Characterization of Carbon Coatings with Low Secondary Electron Yield

CERN Document Server

Yin Vallgren, C; Costa Pinto, P; Kuzucan, A; Neupert, H; Taborelli, M

2011-01-01

Amorphous carbon (a-C) coatings can reliably be produced with a maximum secondary electron yield (SEY) close to 1 at room temperature. Measurements at low temperature (LHe) are in progress. Analysis by X-ray Photoemission Spectroscopy (XPS) shows a correlation between the lineshape of C1s spectrum in XPS and the maximum SEY of the investigated samples. The initial level of oxygen on the surface of the various samples does not seem to be related to the initial maximum SEY value. However, the increase of the SEY with air exposure time on each individual sample is related to the amount of oxygen containing adsorbates. Storage in different environments has been investigated (static vacuum, aluminium foil, dry nitrogen and desiccators), and shows significant differences in the “aging” behaviour. Aging is very moderate when storing samples wrapped in aluminium foil in air. Samples which have undergone aging due to inappropriate storage can be recovered nearly to the initial value of their SEY by surface treatme...

Experimental and theoretical studies on X-ray induced secondary electron yields in Ti and TiO2

International Nuclear Information System (INIS)

Iyasu, Takeshi; Tamura, Keiji; Shimizu, Ryuichi; Vlaicu, Mihai Aurel; Yoshikawa, Hideki

2006-01-01

Generation of X-ray induced secondary electrons in Ti and TiO 2 was studied from both experimental and theoretical approaches, using X-ray photoelectron spectroscopy (XPS) attached to a synchrotron radiation facility and Monte Carlo simulation, respectively. The experiment revealed that the yields of secondary electrons induced by X-rays (electrons/photon) at photon energies to 4950 and 5000eV for Ti and TiO 2 are δ Ti (4950eV)=0.002 and δ Ti (5000eV)=0.014 while those for TiO 2 are δ TiO 2 (4950eV)=0.003 and δ TiO 2 (5000eV)=0.018. A novel approach to obtain the escape depth of secondary electrons has been proposed and applied to Ti and TiO 2 . The approach agreed very well with the experimental data reported so far. The Monte Carlo simulation predicted; δ Ti * (4950eV)=0.002 and δ Ti * (5000eV)=0.011 while δ TiO 2 * (4950eV)=0.003 and δ TiO 2 * (5000eV)=0.015. An experimental examination on the contribution of X-ray induced secondary electrons to photocatalysis in TiO 2 has also been proposed

Low-energy positron and electron diffraction and positron-stimulated secondary electron emission from Cu(100)

International Nuclear Information System (INIS)

Weiss, A.H.

1983-01-01

The results of two series of experiments are reported. In the first, an electrostatically guided beam of low-energy (40-400 eV) positrons, delta/sub p/ was used to study low-energy positron diffraction (LEPD) from a Cu(100) surface under ultrahigh-vacuum conditions. Low-energy electron diffraction (LEED) data were obtained from the same sample in the same apparatus. Comparison of LEPD and LEED intensity versus energy data with model calculations made using computer programs developed by C.B. Duke and collaborators indicated that: LEPD data is adequately modeled using potentials with no exchange-correlation term. The inelastic mean free path, lambda/sub ee/, is shorter for positrons than for electrons at low (< approx.80 eV). LEED is better than LEPD at making a determination of the first-layer spacing of Cu(100) for the particular data set reported. In the second set of experiments, the same apparatus and sample were used to compare positron- and electron-stimulated secondary-electron emission (PSSEE and ESSEE). The results were found to be consistent with existing models of secondary-electron production for metals. The energy distributions of secondary-electrons had broad low-energy (<10 eV) peaks for both positron and electron stimulation. But the PSEE distribution showed no elastic peak. Measurements of secondary-electron angular distributions, found to be cosine-like in both the PSSEE and ESSEE case, were used to obtain total secondary yield ratios, delta, at four beam energies ranging from 40-400 eV. The secondary yield ratio for primary positrons and the yield for primary electrons, delta/sub e/, were similar at these energies. For 400-eV primary particles the secondary yields were found to be delta/sub p/ = 0.94 +/- 0.12 and delta/sub e/ = 0.94 +/- 0./12, giving a ratio of unity for positron-stimulated secondary yield to electron-stimulated secondary yield

Low Secondary Electron Yield Carbon Coatings for Electron-cloud Mitigation in Modern Particle Accelerators

CERN Document Server

Yin Vallgren, Christina; Calatroni, Sergio; Chiggiato, Paolo; Costa Pinto, Pedro; Marques, Hugo; Neupert, Holger; Taborelli, Mauro; Vollenberg, Wilhelmus; Wevers, Ivo; Yaqub, Kashif

2010-01-01

Electron-cloud is one of the main limitations for particle accelerators with positively charged beams of high intensity and short bunch spacing, as the SPS at CERN. The Secondary Electron Yield (SEY) of the inner surface of the vacuum chamber is the main parameter governing the phenomenon. The effect could be eliminated by coating the vacuum chambers with a material of low SEY, which does not require bake-out and is robust against air exposure. For such a purpose amorphous carbon (a-C) coatings were produced by magnetron sputtering of graphite targets. They exhibit maximum SEY between 0.95 and 1.05 after air transfer to the measuring instrument. After 1 month of air exposure the SEY rises by 10 - 20 % of the initial values. Storage in desiccator or by packaging in Al foil makes this increase negligible. The coatings have a similar X-ray photoelectron spectroscopy (XPS) C1s spectrum for a large set of deposition parameters and exhibit an enlarged linewidth compared to HOPG graphite. The static outgassing witho...

Secondary Electron Emission Materials for Transmission Dynodes in Novel Photomultipliers: A Review

Directory of Open Access Journals (Sweden)

Shu Xia Tao

2016-12-01

Full Text Available Secondary electron emission materials are reviewed with the aim of providing guidelines for the future development of novel transmission dynodes. Materials with reflection secondary electron yield higher than three and transmission secondary electron yield higher than one are tabulated for easy reference. Generations of transmission dynodes are listed in the order of the invention time with a special focus on the most recent atomic-layer-deposition synthesized transmission dynodes. Based on the knowledge gained from the survey of secondary election emission materials with high secondary electron yield, an outlook of possible improvements upon the state-of-the-art transmission dynodes is provided.

Experimental study on secondary electron emission characteristics of Cu

Science.gov (United States)

Liu, Shenghua; Liu, Yudong; Wang, Pengcheng; Liu, Weibin; Pei, Guoxi; Zeng, Lei; Sun, Xiaoyang

2018-02-01

Secondary electron emission (SEE) of a surface is the origin of the multipacting effect which could seriously deteriorate beam quality and even perturb the normal operation of particle accelerators. Experimental measurements on secondary electron yield (SEY) for different materials and coatings have been developed in many accelerator laboratories. In fact, the SEY is just one parameter of secondary electron emission characteristics which include spatial and energy distribution of emitted electrons. A novel experimental apparatus was set up in China Spallation Neutron Source, and an innovative method was applied to obtain the whole characteristics of SEE. Taking Cu as the sample, secondary electron yield, its dependence on beam injection angle, and the spatial and energy distribution of secondary electrons were achieved with this measurement device. The method for spatial distribution measurement was first proposed and verified experimentally. This contribution also tries to give all the experimental results a reasonable theoretical analysis and explanation.

Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method

Energy Technology Data Exchange (ETDEWEB)

Tondu, Thomas; Belhaj, Mohamed; Inguimbert, Virginie [Onera, DESP, 2 Avenue Edouard Belin, 31400 Toulouse (France); Onera, DESP, 2 Avenue Edouard Belin, 31400 Toulouse, France and Fondation STAE, 4 allee Emile Monso, BP 84234-31432, Toulouse Cedex 4 (France); Onera, DESP, 2 Avenue Edouard Belin, 31400 Toulouse (France)

2010-09-15

Secondary electron emission yield of gold under electron impact at normal incidence below 50 eV was investigated by the classical collector method and by the Kelvin probe method. The authors show that biasing a collector to ensure secondary electron collection while keeping the target grounded can lead to primary electron beam perturbations. Thus reliable secondary electron emission yield at low primary electron energy cannot be obtained with a biased collector. The authors present two collector-free methods based on current measurement and on electron pulse surface potential buildup (Kelvin probe method). These methods are consistent, but at very low energy, measurements become sensitive to the earth magnetic field (below 10 eV). For gold, the authors can extrapolate total emission yield at 0 eV to 0.5, while a total electron emission yield of 1 is obtained at 40{+-}1 eV.

Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method

International Nuclear Information System (INIS)

Tondu, Thomas; Belhaj, Mohamed; Inguimbert, Virginie

2010-01-01

Secondary electron emission yield of gold under electron impact at normal incidence below 50 eV was investigated by the classical collector method and by the Kelvin probe method. The authors show that biasing a collector to ensure secondary electron collection while keeping the target grounded can lead to primary electron beam perturbations. Thus reliable secondary electron emission yield at low primary electron energy cannot be obtained with a biased collector. The authors present two collector-free methods based on current measurement and on electron pulse surface potential buildup (Kelvin probe method). These methods are consistent, but at very low energy, measurements become sensitive to the earth magnetic field (below 10 eV). For gold, the authors can extrapolate total emission yield at 0 eV to 0.5, while a total electron emission yield of 1 is obtained at 40±1 eV.

Modified Sternglass theory for the emission of secondary electrons by fast-electron impact

International Nuclear Information System (INIS)

Suszcynsky, D.M.; Borovsky, J.E.

1992-01-01

The Sternglass theory [Sternglass, Phys. Rev. 108, 1 (1957)] for fast-ion-induced secondary-electron emission from metals has been modified to predict the secondary-electron yield from metals impacted by energetic (several keV to about 200 keV) electrons. The primary modification of the theory accounts for the contribution of the backscattered electrons to the production of secondary electrons based on a knowledge of the backscattered-electron energy distribution. The modified theory is in reasonable agreement with recent experimental data from gold targets in the 6--30-keV electron energy range

Analysis of secondary electron emission for conducting materials using 4-grid LEED/AES optics

International Nuclear Information System (INIS)

Patino, M I; Wirz, R E; Raitses, Y; Koel, B E

2015-01-01

A facility utilizing 4-grid optics for LEED/AES (low energy electron diffraction/Auger electron spectroscopy) was developed to measure the total secondary electron yield and secondary electron energy distribution function for conducting materials. The facility and experimental procedure were validated with measurements of 50–500 eV primary electrons impacting graphite. The total yield was calculated from measurements of the secondary electron current (i) from the sample and (ii) from the collection assembly, by biasing each surface. Secondary electron yield results from both methods agreed well with each other and were within the spread of previous results for the total yield from graphite. Additionally, measurements of the energy distribution function of secondary electrons from graphite are provided for a wider range of incident electron energies. These results can be used in modeling plasma-wall interactions in plasmas bounded by graphite walls, such as are found in plasma thrusters, and divertors and limiters of magnetic fusion devices. (paper)

Secondary electron measurement and XPS characterization of NEG coatings

International Nuclear Information System (INIS)

Sharma, R. K.; Sinha, Atul K.; Gupta, Nidhi; Nuwad, J.; Jagannath,; Gadkari, S. C.; Singh, M. R.; Gupta, S. K.

2014-01-01

Ternary alloy coatings of IVB and VB materials provide many of benefits over traditional material surfaces such as creation of extreme high vacuum(XHV), lower secondary electron yield(SEY), low photon desorption coefficient. XHV (pressure −10 mbar) is very useful to the study of surfaces of the material in as it is form, high energy particle accelerators(LHC, Photon Factories), synchrotrons (ESRF, Ellectra) etc.. Low secondary electron yield leads to very low multi-pacting utilizes to increase beam life time. In this paper preparation of the coatings and a study of secondary electron yield measurement after heating at different temperatures has been shown also results of their surface characterization based on shift in binding energy has been produced using the surface techniques XPS. Stoichiometry of the film was measured by Energy dispersive x-ray analysis (EDX)

Secondary electron emission from 0.5--2.5-MeV protons and deuterons

International Nuclear Information System (INIS)

Thornton, T.A.; Anno, J.N.

1977-01-01

Measurement of the secondary electron currents leaving Al, V, Fe, 316 stainless steel, Nb, and Mo foils undergoing 0.5--2.5-MeV proton and deuteron bombardment were made to determine the secondary electron emission ratios for these ions. The measured secondary electron yields were of the order of 1.0, with the deuterons producing generally higher yields than the protons

Suppression secondary electrons from target surface under pulsed ion beams bombardment

International Nuclear Information System (INIS)

Yang Zhen; Peng Yufei; Long Jidong; Lan Chaohui; Dong Pan; Shi Jinshui

2012-01-01

The producing mechanism of secondary electrons from target surface under ion beams bombardment is discussed. Several methods to suppress the secondary electrons in special vacuum devices and their advantages and disadvantages are introduced. The ways of using self-bias and curved surface target are proposed and verified in the experiment. The results show that the secondary electrons can be effectively suppressed when the self-bias is larger than 80 V. The secondary electron yield decreases by using curved surface target instead of flat target. The secondary electron yield calculated from the experimental data is about 0.67, which is slightly larger than the value (0.58) from the literature due to the impurities of the ion beam and target surface. The effect of suppressing the electron countercurrent by the self-bias method is analyzed. The result shows that the self-bias method can not only suppress the secondary electrons from target surface under ion beams bombardment, but also suppress the electron countercurrent resulting from the instability of the pulsed power source. (authors)

The Effect of Gas Ion Bombardment on the Secondary Electron Yield of TiN, TiCN and TiZrV Coatings For Suppressing Collective Electron Effects in Storage Rings

International Nuclear Information System (INIS)

Le Pimpec, F.; Kirby, R.E.; King, F.K.; Pivi, M.

2006-01-01

In many accelerator storage rings running positively charged beams, ionization of residual gas and secondary electron emission (SEE) in the beam pipe will give rise to an electron cloud which can cause beam blow-up or loss of the circulating beam. A preventative measure that suppresses electron cloud formation is to ensure that the vacuum wall has a low secondary emission yield (SEY). The SEY of thin films of TiN, sputter deposited Non-Evaporable Getters and a novel TiCN alloy were measured under a variety of conditions, including the effect of re-contamination from residual gas

The Activation of Non-evaporable Getters Monitored by AES, XPS, SSIMS and Secondary Electron Yield Measurements

CERN Document Server

Scheuerlein, C

2002-01-01

In this thesis the potential of the three classical surface analysis techniques Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS) for the characterisation of non-evaporable getter (NEG) materials is assessed and artefacts are described. The various NEG samples have been analysed in the context of the development of NEG thin film coatings for use in accelerator ultra high vacuum (UHV) systems. The secondary electron yield (SEY), which is a functional surface property of great importance for the application of NEG to accelerators, has been measured. The maximum SEY of an air exposed TiZr and TiZrV coating can be reduced from above 2.0 to below 1.1 during a 2 h heat treatment at 250 and 200 °C, respectively. Saturating an activated TiZrV surface in UHV increases the maximum SEY by about 0.1. Thus, in UHV the SEY of an activated NEG coating does not exceed the threshold value of 1.35, above which multipacting is predicted to occur in th...

Monte Carlo calculation of secondary electron emission from carbon-surface by obliquely incident particles

International Nuclear Information System (INIS)

Ohya, Kaoru; Kawata, Jun; Mori, Ichiro

1990-01-01

Incidence angle dependences of secondary electron emission from a carbon surface by low energy electron and hydrogen atom are calculated using Monte Carlo simulations on the kinetic emission model. The calculation shows very small increase or rather decrease of the secondary electron yield with oblique incidence. It is explained in terms of not only multiple elastic collisions of incident particles with the carbon atoms but also small penetration depth of the particles comparable with the escape depth of secondary electrons. In addition, the two types of secondary electron emission are distinguished by using the secondary electron yield statistics; one is the emission due to trapped particles in the carbon, and the other is that due to backscattered particles. The high-yield component of the statistics on oblique incidence is more suppressed than those on normal incidence. (author)

Measurement of the secondary electron emission from CVD diamond films using phosphor screen detectors

Science.gov (United States)

Vaz, R.; May, P. W.; Fox, N. A.; Harwood, C. J.; Chatterjee, V.; Smith, J. A.; Horsfield, C. J.; Lapington, J. S.; Osbourne, S.

2015-03-01

Diamond-based photomultipliers have the potential to provide a significant improvement over existing devices due to diamond's high secondary electron yield and narrow energy distribution of secondary electrons which improves energy resolution creating extremely fast response times. In this paper we describe an experimental apparatus designed to study secondary electron emission from diamond membranes only 400 nm thick, observed in reflection and transmission configurations. The setup consists of a system of calibrated P22 green phosphor screens acting as radiation converters which are used in combination with photomultiplier tubes to acquire secondary emission yield data from the diamond samples. The superior signal voltage sampling of the phosphor screen setup compared with traditional Faraday Cup detection allows the variation in the secondary electron yield across the sample to be visualised, allowing spatial distributions to be obtained. Preliminary reflection and transmission yield data are presented as a function of primary electron energy for selected CVD diamond films and membranes. Reflection data were also obtained from the same sample set using a Faraday Cup detector setup. In general, the curves for secondary electron yield versus primary energy for both measurement setups were comparable. On average a 15-20% lower signal was recorded on our setup compared to the Faraday Cup, which was attributed to the lower photoluminescent efficiency of the P22 phosphor screens when operated at sub-kilovolt bias voltages.

On the regularities of gamma-ray initiated emission of really-secondary electrons

International Nuclear Information System (INIS)

Grudskij, M.Ya.; Roldugin, N.N.; Smirnov, V.V.

1982-01-01

Emission regularities of the really-secondary electrons from metals are discussed on the basis of experimental data on electron emission characteristics under gamma radiation of incident quanta produced for a wide energy range (Esub(γ)=0.03+-2 MeV) and atomic numbers of target materials (Z=13+-79). Comparison with published experimental and calculated data is performed. It is shown that yield of the really-secondary electrons into vacuum from the target surface bombarded with a normally incident collimated beam of gamma radiation calculating on energy unit absorbed in the yield zone of the really-secondary electrons is determined only with the target material emittivity and can be calculated if spatial-energy distributions and the number of secondary fast electrons emitted out of the target are known

An experimental assessment of proposed universal yield curves for secondary electron emission

International Nuclear Information System (INIS)

Salehi, M.; Flinn, E.A.

1980-01-01

A variety of 'Universal Yield Curves' for the secondary emission process have been proposed. A series of precise measurements of the secondary emission properties of a range of related amorphous semiconducting materials, made under UHV on freshly vacuum-cleaved surfaces, and covering a wide range of primary energies, have recently made possible an accurate assessment of the validity of the various UYC's suggested. It is found that no truly universal curve exists; the atomic number of the target material plays an important part in determining the secondary emission properties. Agarwal's (Proc. Phys. Soc.; 71: 851 (1958)) semi-empirical expression, which takes account of the atomic number and weight, is found to give good agreement for all the materials studied. Further theoretical investigation is required. (author)

Secondary electron emission with molecular projectiles

International Nuclear Information System (INIS)

Kroneberger, K.; Rothard, H.; Koschar, P.; Lorenzen, P.; Kemmler, J.; Keller, N.; Maier, R.; Groeneveld, K.O.; Clouvas, A.; Veje, E.

1990-01-01

The authors present results for the secondary electron emission (SEE) from thin foil targets, induced by both molecular ions and their atomic constituents as projectiles. The Sternglass theory for kinetic SEE states a proportionality between γ and the electronic stopping power, S e , which has been verified in various experiments. With comparing secondary electron (SE) yields induced by molecular projectiles to those induced by monoatomic projectiles, it is therefore possible to test models for the energy loss of molecular or cluster projectiles. Since the atomic constituents of the molecule are repelled from each other due to Coulomb explosion (superimposed by multiple scattering) while traversing the solid, it is interesting to measure the residual mutual influence on SEE and S e with increasing internuclear separation. This can only be achieved with thin foils, where (as in the present case) the SE-yields from the exit surface can be measured separately. The authors measured the SE-yields from the entrance (γ B ) and exit (γ F ) surfaces of thin C- and Al-foils (150 to 1,000 angstrom) with CO + , C + and O + (15 to 85 keV/u) and H 2 + and H + (0.3 to 1.2 MeV/u). The molecular effect defined as the ratio R(γ) between the yields induced by molecular projectiles and the sum of those induced by their atomic constituents was calculated. The energy dependence of R(γ) can be well represented by the calculated energy loss ratio of di-proton-clusters by Brandt. This supports Brandt's model for the energy loss of clusters

Reduction of secondary electron yield for E-cloud mitigation by laser ablation surface engineering

Energy Technology Data Exchange (ETDEWEB)

Valizadeh, R., E-mail: reza.valizadeh@stfc.ac.uk [ASTeC, STFC Daresbury Laboratory, Warrington WA4 4AD (United Kingdom); Malyshev, O.B. [ASTeC, STFC Daresbury Laboratory, Warrington WA4 4AD (United Kingdom); Wang, S. [ASTeC, STFC Daresbury Laboratory, Warrington WA4 4AD (United Kingdom); Department of Physics, Loughborough University, Loughborough LE11 3TU (United Kingdom); Sian, T. [ASTeC, STFC Daresbury Laboratory, Warrington WA4 4AD (United Kingdom); The Photon Science Institute, The University of Manchester, Manchester M13 9PL (United Kingdom); Cropper, M.D. [Department of Physics, Loughborough University, Loughborough LE11 3TU (United Kingdom); Sykes, N. [Micronanics Ltd., Didcot, Oxon OX11 0QX (United Kingdom)

2017-05-15

Highlights: • SEY below 1 can be achieved with Laser ablation surface engineering. • SEY <1 surface can be produced with different types of nanosecond lasers. • Both microstructure (groves) and nano-structures are playing a role in reducing SEY. - Abstract: Developing a surface with low Secondary Electron Yield (SEY) is one of the main ways of mitigating electron cloud and beam-induced electron multipacting in high-energy charged particle accelerators. In our previous publications, a low SEY < 0.9 for as-received metal surfaces modified by a nanosecond pulsed laser was reported. In this paper, the SEY of laser-treated blackened copper has been investigated as a function of different laser irradiation parameters. We explore and study the influence of micro- and nano-structures induced by laser surface treatment in air of copper samples as a function of various laser irradiation parameters such as peak power, laser wavelength (λ = 355 nm and 1064 nm), number of pulses per point (scan speed and repetition rate) and fluence, on the SEY. The surface chemical composition was determined by x-ray photoelectron spectroscopy (XPS) which revealed that heating resulted in diffusion of oxygen into the bulk and induced the transformation of CuO to sub-stoichiometric oxide. The surface topography was examined with high resolution scanning electron microscopy (HRSEM) which showed that the laser-treated surfaces are dominated by microstructure grooves and nanostructure features.

Monte Carlo simulation of positron induced secondary electrons in thin carbon foils

International Nuclear Information System (INIS)

Cai, L H; Yang, B; Ling, C C; Beling, C D; Fung, S

2011-01-01

Emission of secondary electrons induced by the passage of low energy positrons through thin carbon foils was studied by the Monte Carlo method. The positron and electron elastic cross sections were calculated by partial wave analysis. The inelastic positron-valence-electron was described by the energy loss function obtained from dielectric theory. The positron-core-electron interaction was modelled by the Gryzinski's excitation function. Positron transport inside the carbon foil was simulated in detail. Secondary electrons created by positrons and high energy secondary electrons through inelastic interactions were tracked through the foil. The positron transmission coefficient and secondary electron yielded in forward and backward geometry are calculated and dependences on positron energy and carbon foil thickness are discussed.

Heavy-ion induced secondary electron emission from Mg, Al, and Si partially covered with oxygen

International Nuclear Information System (INIS)

Weng, J; Veje, E.

1984-01-01

We have bombarded Mg, Al, and Si with 80 keV Ar + ions and measured the secondary electron emission yields at projectile incidence angles from 0 0 to 85 0 , with oxygen present at the target as well as under UHV conditions. The total secondary electron emission yields are found to depend fairly much on the amount of oxygen present. The three elements studied show relatively large individual variations. For all three elements, and with as well as without oxygen present, the relative secondary electron emission yield is observed to vary as 1/cos v, where v is the angle of incidence of the projectiles. This seems to indicate that the secondary electron production is initiated uniformly along the projectile path in the solid, in a region close to the surface. The results are discussed, and it is tentatively suggested, that the increase in secondary electron emission, caused by the presence of oxygen, originates from neutralization of sputtered oxygen, which initially is sitting as O 2- ions. (orig.)

Transport Theory for Kinetic Emission of Secondary Electrons from Solids

DEFF Research Database (Denmark)

Schou, Jørgen

1980-01-01

a solid is derived. To find the former, existing computations for ion slowing down and experimental and theoretical ones for electron bombardment can be utilized. The energy and angular distribution of the secondary electrons and the secondary electron yield are both expressed as products of the deposited...... in the keV region is largely taken into account. The predicted energy and angular distribution agree with absolute spectra for incident electrons, whereas the agreement with absolute spectra for incident protons is less satisfactory. Extrapolation of the energy distribution down to the vacuum level gives...

Secondary electron/reflected particle coincidence studies during slow highly charged ion-surface interactions

Energy Technology Data Exchange (ETDEWEB)

McGrath, C.T.; Szilagyi, Z.; Shah, M.B.; McCullough, R.W. [Queen' s Univ., Belfast, Northern Ireland (United Kingdom); Woolsey, J.M. [Stirling Univ. (United Kingdom). DBMS; Trassl, R.; Salzborn, E. [Giessen Univ. (Germany). Inst. fuer Kernphysik

2001-07-01

We have measured the secondary electron emission statistics (ES) for 5 keV N{sup q+} (q = 1-4) ions incident at 10 on polycrystalline aluminium, in coincidence with specularly reflected N{sup 0}. In this arrangement the kinetic contribution to secondary electron emission is minimised. The experimental data shows that the coincident electron yield, {gamma}, increases linearly with incident ion charge state. The kinetic emission contribution has also been determined from this data. The ES due to 2 and 4 keV He{sup 2+} impact on polycrystalline aluminium in coincidence with specularly reflected He{sup +} and He{sup 0} have also been determined. The process He{sup 2+} {yields} He{sup 0} yields a larger {gamma} value than the process He{sup 2+} {yields} He{sup +}. (orig.)

Study on the Secondary Electron Yield γ of Insulator for PDP Cathode

Science.gov (United States)

Motoyama, Y.; Ushirozawa, M.; Matsuzaki, H.; Takano, Y.; Seki, M.

1999-10-01

The secondary electron yield γ of the Plasma Display Panel (PDP) cathode is an important research object because it is closely related to the discharge voltages etc. For metal cathodes, we made a comprehensive examination^1 of γ for all rare gas ions and metastables according to Hagstrum's theory.^2 For γ of MgO, which is the useful insulator cathode, Aboelfotoh et al.^3 calculated the values for Ne and Ar ions supposing a monochrome PDP. However, the values of γ for other rare gas ions and their metastables necessary for a full color PDP have not yet been calculated. These values are calculated in the present study after them. The results are as follows: For ions, He:0.481 and Kr,Xe:0, assuming that there are no impurity levels in MgO; For metastables, He:0.491, Ne:0.489, Ar:0.428, Kr:0.381, and Xe:0.214. These results should serve as useful parameters in discharge simulation for the PDP. ^1H. Matsuzaki: Trans. IEE Jpn., 111-A, 971 (1991). ^2H.D. Hagstrum: Phys. Rev., 96, 336 (1954), ibid., 122, 83 (1961). ^3M.O. Aboelfotoh and J.A. Lorenzen: J. Appl. Phys., 48, 4754 (1977).

1D numerical simulation of charge trapping in an insulator submitted to an electron beam irradiation. Part I: Computation of the initial secondary electron emission yield

International Nuclear Information System (INIS)

Aoufi, A.; Damamme, G.

2011-01-01

The aim of this work is to study by numerical simulation a mathematical modelling technique describing charge trapping during initial charge injection in an insulator submitted to electron beam irradiation. A two-fluxes method described by a set of two stationary transport equations is used to split the electron current j e (z) into coupled forward j e+ (z) and backward j e (z) currents and such that j e (z) = j e+ (z) - j e- (z). The sparse algebraic linear system, resulting from the vertex-centered finite-volume discretization scheme is solved by an iterative decoupled fixed point method which involves the direct inversion of a bi-diagonal matrix. The sensitivity of the initial secondary electron emission yield with respect to the energy of incident primary electrons beam, that is penetration depth of the incident beam, or electron cross sections (absorption and diffusion) is investigated by numerical simulations. (authors)

Carbon buildup monitoring using RBS: Correlation with secondary electrons

International Nuclear Information System (INIS)

Aguilera, E.F.; Rosales, P.; Martinez-Quiroz, E.; Murillo, G.; Fernandez, M.C.

2006-01-01

The RBS technique is applied to solve the problem of on-line monitoring of the carbon deposited on a thin backed foil under ion bombardment. An iterative method is used to reliably extract quantities such as number of projectiles and target thickness in spite of beam energy changes and detector unstabilities. Experimental values for secondary electron yields are also deduced. Results are reported for the thickness variation of thin carbon foils bombarded with carbon ions of energies between 8.95 and 13 MeV. A linear correlation of this variation is found with both, the ion fluence at target and the number of secondary electrons emitted. The correlation exists even though a wide range of beam currents, beam energies and bombarding times was used during the experiment. The measured electron yields show evidence for a change in the emission process between the original foils and the deposited layer, possibly due to a texture change

The secondary electron yield of TiZr and TiZrV non evaporable getter thin film coatings

CERN Document Server

Scheuerlein, C; Hilleret, Noël; Taborelli, M

2001-01-01

The secondary electron yield (SEY) of two different non evaporable getter (NEG) samples has been measured 'as received' and after thermal treatment. The investigated NEGs are TiZr and TiZrV thin film coatings of 1 mm thickness, which are sputter deposited onto copper substrates. The maximum SEY dmax of the air exposed TiZr and TiZrV coating decreases from above 2.0 to below 1.1 during a 2 hour heat treatment at 250 °C and 200 °C, respectively. Saturating an activated TiZrV surface under vacuum with the gases typically present in ultra high vacuum systems increases dmax by about 0.1. Changes in elemental surface composition during the applied heat treatments were monitored by Auger electron spectroscopy (AES). After activation carbon, oxygen and chlorine were detected on the NEG surfaces. The potential of AES for detecting the surface modifications which cause the reduction of SE emission during the applied heat treatments is critically discussed.

Quantitative secondary electron detection

Science.gov (United States)

Agrawal, Jyoti; Joy, David C.; Nayak, Subuhadarshi

2018-05-08

Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.

Simulation study of secondary electron images in scanning ion microscopy

CERN Document Server

Ohya, K

2003-01-01

The target atomic number, Z sub 2 , dependence of secondary electron yield is simulated by applying a Monte Carlo code for 17 species of metals bombarded by Ga ions and electrons in order to study the contrast difference between scanning ion microscopes (SIM) and scanning electron microscopes (SEM). In addition to the remarkable reversal of the Z sub 2 dependence between the Ga ion and electron bombardment, a fine structure, which is correlated to the density of the conduction band electrons in the metal, is calculated for both. The brightness changes of the secondary electron images in SIM and SEM are simulated using Au and Al surfaces adjacent to each other. The results indicate that the image contrast in SIM is much more sensitive to the material species and is clearer than that for SEM. The origin of the difference between SIM and SEM comes from the difference in the lateral distribution of secondary electrons excited within the escape depth.

Two-dimensional simulation research of secondary electron emission avalanche discharge on vacuum insulator surface

Science.gov (United States)

Cai, Libing; Wang, Jianguo; Zhu, Xiangqin; Wang, Yue; Zhang, Dianhui

2015-01-01

Based on the secondary electron emission avalanche (SEEA) model, the SEEA discharge on the vacuum insulator surface is simulated by using a 2D PIC-MCC code developed by ourselves. The evolutions of the number of discharge electrons, insulator surface charge, current, and 2D particle distribution are obtained. The effects of the strength of the applied electric field, secondary electron yield coefficient, rise time of the pulse, length of the insulator on the discharge are investigated. The results show that the number of the SEEA electrons presents a quadratic dependence upon the applied field strength. The SEEA current, which is on the order of Ampere, is directly proportional to the field strength and secondary electron yield coefficient. Finally, the electron-stimulated outgassing is included in the simulation code, and a three-phase discharge curve is presented by the simulation, which agrees with the experimental data.

Two-dimensional simulation research of secondary electron emission avalanche discharge on vacuum insulator surface

International Nuclear Information System (INIS)

Cai, Libing; Wang, Jianguo; Zhu, Xiangqin; Wang, Yue; Zhang, Dianhui

2015-01-01

Based on the secondary electron emission avalanche (SEEA) model, the SEEA discharge on the vacuum insulator surface is simulated by using a 2D PIC-MCC code developed by ourselves. The evolutions of the number of discharge electrons, insulator surface charge, current, and 2D particle distribution are obtained. The effects of the strength of the applied electric field, secondary electron yield coefficient, rise time of the pulse, length of the insulator on the discharge are investigated. The results show that the number of the SEEA electrons presents a quadratic dependence upon the applied field strength. The SEEA current, which is on the order of Ampere, is directly proportional to the field strength and secondary electron yield coefficient. Finally, the electron-stimulated outgassing is included in the simulation code, and a three-phase discharge curve is presented by the simulation, which agrees with the experimental data

The secondary electron yield of air exposed metal surfaces at the example of niobium

CERN Document Server

Scheuerlein, C; Taborelli, M

2002-01-01

The secondary electron yield (SEY) variation of atomically clean metal surfaces due to air exposures and during subsequent heat treatments is described with the example of a sputter-deposited Nb thin film. Corresponding variations of the surface chemical composition have been monitored using AES and SSIMS. On the basis of these results and of previously obtained SEY results on metals and metal oxides the origin of the SEY variations is discussed. The SEY increase, which is generally observed during long lasting air exposures of clean metals, is mainly caused by the adsorption of an airborne carbonaceous contamination layer. The estimated value of about 3 for the maximum SEY of this layer is higher than that of all pure metals. Only in some cases the air-formed oxide can contribute to the air exposure induced SEY increase while many oxides have a lower SEY than their parent metals. From the experimental data it can also be excluded that the SEY increase during air exposures is mainly due to an increased second...

Initial vibrational and rotational yields from subexcitation electrons in molecular hydrogen

International Nuclear Information System (INIS)

Douthat, D.A.

1987-01-01

As the energy of a single source electron injected into a molecular gas is degraded through collisions, initial products include secondary electrons, ions, and excited molecules. Electrons with kinetic energies less than the minimum required for excitation of the lowest electronic state are given the designation subexcitation electrons. These electrons are still capable of exciting vibrational and rotational states of molecular gases. In this calculation, the initial numbers of vibrational and rotational excitations (yields) produced as the subexcitation electrons undergo further energy degradation are determined for molecular hydrogen. The calculation requires a complete set of cross section data for numerical solution of the Boltzmann equation. The initial energy distribution of electrons is taken to be the subexcitation distribution which was determined previously. The initial yields are tabulated for gas temperatures from 50 K to 1500 K for a source electron with initial energy 10 keV. 26 references

Transport of secondary electrons and reactive species in ion tracks

Science.gov (United States)

Surdutovich, Eugene; Solov'yov, Andrey V.

2015-08-01

The transport of reactive species brought about by ions traversing tissue-like medium is analysed analytically. Secondary electrons ejected by ions are capable of ionizing other molecules; the transport of these generations of electrons is studied using the random walk approximation until these electrons remain ballistic. Then, the distribution of solvated electrons produced as a result of interaction of low-energy electrons with water molecules is obtained. The radial distribution of energy loss by ions and secondary electrons to the medium yields the initial radial dose distribution, which can be used as initial conditions for the predicted shock waves. The formation, diffusion, and chemical evolution of hydroxyl radicals in liquid water are studied as well. COST Action Nano-IBCT: Nano-scale Processes Behind Ion-Beam Cancer Therapy.

Secondary-electron-bremsstrahlung imaging for proton therapy

Energy Technology Data Exchange (ETDEWEB)

Yamaguchi, Mitsutaka; Nagao, Yuto [Takasaki Advanced Radiation Research Institute, Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology, 1233 Watanuki-Machi, Takasaki, Gunma (Japan); Ando, Koki; Yamamoto, Seiichi [Department of Radiological and Medical Laboratory Sciences, Nagoya University Graduate School of Medicine, 1-1-20 Daiko-Minami, Higashi-Ku, Nagoya, Aichi (Japan); Toshito, Toshiyuki [Department of Proton Therapy Physics, Nagoya Proton Therapy Center, Nagoya City West Medical Center, 1-1-1 Hirate-cho, Kita-Ku, Nagoya, Aichi (Japan); Kataoka, Jun [Research Institute for Science and Engineering, Waseda University, 3-4-1 Okubo, Shinjuku, Tokyo (Japan); Kawachi, Naoki [Takasaki Advanced Radiation Research Institute, Quantum Beam Science Research Directorate, National Institutes for Quantum and Radiological Science and Technology, 1233 Watanuki-Machi, Takasaki, Gunma (Japan)

2016-10-11

A feasibility study on an imaging technique of a therapeutic proton-beam trajectory using a gamma camera by measuring secondary electron bremsstrahlung (SEB) was performed by means of Monte Carlo simulations and a beam-irradiation experiment. From the simulation and experimental results, it was found that a significant amount of SEB yield exists between the beam-injection surface and the range position along the beam axis and the beam trajectory is clearly imaged by the SEB yield. It is concluded that the SEB imaging is a promising technique for monitoring of therapeutic proton-beam trajectories.

Monte-Carlo simulations of secondary electron emission from CsI, induced by 1-10 keV X-rays and electrons

International Nuclear Information System (INIS)

Akkerman, A.; Gibrekhterman, A.; Breskin, A.; Chechik, R.

1992-05-01

A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross-sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by X-rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides. (author)

Probabilistic model for the simulation of secondary electron emission

Directory of Open Access Journals (Sweden)

M. A. Furman

2002-12-01

Full Text Available We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary-emission yield and the emitted-energy spectrum. We provide two sets of values for the parameters by fitting our model to two particular data sets, one for copper and the other one for stainless steel.

Monte Carlo modeling of ion beam induced secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Huh, U., E-mail: uhuh@vols.utk.edu [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Cho, W. [Electrical and Computer Engineering, University of Tennessee, Knoxville, TN 37996-2100 (United States); Joy, D.C. [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)

2016-09-15

Ion induced secondary electrons (iSE) can produce high-resolution images ranging from a few eV to 100 keV over a wide range of materials. The interpretation of such images requires knowledge of the secondary electron yields (iSE δ) for each of the elements and materials present and as a function of the incident beam energy. Experimental data for helium ions are currently limited to 40 elements and six compounds while other ions are not well represented. To overcome this limitation, we propose a simple procedure based on the comprehensive work of Berger et al. Here we show that between the energy range of 10–100 keV the Berger et al. data for elements and compounds can be accurately represented by a single universal curve. The agreement between the limited experimental data that is available and the predictive model is good, and has been found to provide reliable yield data for a wide range of elements and compounds. - Highlights: • The Universal ASTAR Yield Curve was derived from data recently published by NIST. • IONiSE incorporated with the Curve will predict iSE yield for elements and compounds. • This approach can also handle other ion beams by changing basic scattering profile.

Secondary electron emission from lithium and lithium compounds

Energy Technology Data Exchange (ETDEWEB)

Capece, A. M., E-mail: capecea@tcnj.edu [Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States); Department of Physics, The College of New Jersey, Ewing, New Jersey 08628 (United States); Patino, M. I.; Raitses, Y. [Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 (United States); Koel, B. E. [Department of Chemical and Biological Engineering, Princeton University, Princeton, New Jersey 08540 (United States)

2016-07-04

In this work, measurements of electron-induced secondary electron emission (SEE) yields of lithium as a function of composition are presented. The results are particularly relevant for magnetic fusion devices such as tokamaks, field-reversed configurations, and stellarators that consider Li as a plasma-facing material for improved plasma confinement. SEE can reduce the sheath potential at the wall and cool electrons at the plasma edge, resulting in large power losses. These effects become significant as the SEE coefficient, γ{sub e}, approaches one, making it imperative to maintain a low yield surface. This work demonstrates that the yield from Li strongly depends on chemical composition and substantially increases after exposure to oxygen and water vapor. The total yield was measured using a retarding field analyzer in ultrahigh vacuum for primary electron energies of 20–600 eV. The effect of Li composition was determined by introducing controlled amounts of O{sub 2} and H{sub 2}O vapor while monitoring film composition with Auger electron spectroscopy and temperature programmed desorption. The results show that the energy at which γ{sub e} = 1 decreases with oxygen content and is 145 eV for a Li film that is 17% oxidized and drops to less than 25 eV for a fully oxidized film. This work has important implications for laboratory plasmas operating under realistic vacuum conditions in which oxidation significantly alters the electron emission properties of Li walls.

Secondary electron emission from lithium and lithium compounds

International Nuclear Information System (INIS)

Capece, A. M.; Patino, M. I.; Raitses, Y.; Koel, B. E.

2016-01-01

In this work, measurements of electron-induced secondary electron emission (SEE) yields of lithium as a function of composition are presented. The results are particularly relevant for magnetic fusion devices such as tokamaks, field-reversed configurations, and stellarators that consider Li as a plasma-facing material for improved plasma confinement. SEE can reduce the sheath potential at the wall and cool electrons at the plasma edge, resulting in large power losses. These effects become significant as the SEE coefficient, γ e , approaches one, making it imperative to maintain a low yield surface. This work demonstrates that the yield from Li strongly depends on chemical composition and substantially increases after exposure to oxygen and water vapor. The total yield was measured using a retarding field analyzer in ultrahigh vacuum for primary electron energies of 20–600 eV. The effect of Li composition was determined by introducing controlled amounts of O 2 and H 2 O vapor while monitoring film composition with Auger electron spectroscopy and temperature programmed desorption. The results show that the energy at which γ e  = 1 decreases with oxygen content and is 145 eV for a Li film that is 17% oxidized and drops to less than 25 eV for a fully oxidized film. This work has important implications for laboratory plasmas operating under realistic vacuum conditions in which oxidation significantly alters the electron emission properties of Li walls.

Monte Carlo simulations of secondary electron emission due to ion beam milling

Energy Technology Data Exchange (ETDEWEB)

Mahady, Kyle [Univ. of Tennessee, Knoxville, TN (United States); Tan, Shida [Intel Corp., Santa Clara, CA (United States); Greenzweig, Yuval [Intel Israel Ltd., Haifa (Israel); Livengood, Richard [Intel Corp., Santa Clara, CA (United States); Raveh, Amir [Intel Israel Ltd., Haifa (Israel); Fowlkes, Jason D. [Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Rack, Philip [Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

2017-07-01

We present a Monte Carlo simulation study of secondary electron emission resulting from focused ion beam milling of a copper target. The basis of this study is a simulation code which simulates ion induced excitation and emission of secondary electrons, in addition to simulating focused ion beam sputtering and milling. This combination of features permits the simulation of the interaction between secondary electron emission, and the evolving target geometry as the ion beam sputters material. Previous ion induced SE Monte Carlo simulation methods have been restricted to predefined target geometries, while the dynamic target in the presented simulations makes this study relevant to image formation in ion microscopy, and chemically assisted ion beam etching, where the relationship between sputtering, and its effects on secondary electron emission, is important. We focus on a copper target, and validate our simulation against experimental data for a range of: noble gas ions, ion energies, ion/substrate angles and the energy distribution of the secondary electrons. We then provide a detailed account of the emission of secondary electrons resulting from ion beam milling; we quantify both the evolution of the yield as high aspect ratio valleys are milled, as well as the emission of electrons within these valleys that do not escape the target, but which are important to the secondary electron contribution to chemically assisted ion induced etching.

Secondary electron emission studied by secondary electron energy loss coincidence spectroscopy (SE2ELCS)

International Nuclear Information System (INIS)

Khalid, R.

2013-01-01

Emission of secondary electrons is of importance in many branches of fundamental and applied science. It is widely applied in the electron microscope for the investigation of the structure and electronic state of solid surfaces and particle detection in electron multiplier devices, and generally it is related to the energy dissipation of energetic particles moving inside a solid. The process of secondary electron emission is a complex physical phenomenon, difficult to measure experimentally and treat theoretically with satisfactory accuracy. The secondary electron spectrum measured with single electron spectroscopy does not provide detailed information of the energy loss processes responsible for the emission of secondary electrons. This information can be accessed when two correlated electron pairs are measured in coincidence and the pair consists of a backscattered electron after a given energy loss and a resulting emitted secondary electron. To investigate the mechanisms responsible for the emission of secondary electrons, a reflection (e,2e) coincidence spectrometer named Secondary Electron Electron Energy Loss Coincidence Spectrometer (SE2ELCS) has been developed in the framework of this thesis which allows one to uncover the relation between the features in the spectra which are due to energy losses and true secondary electron emission structures. The correlated electron pairs are measured with a hemispherical mirror analyzer (HMA) and a time of flight analyzer (TOF) by employing a continuous electron beam. An effort has been made to increase the coincidence count rate by increasing the effective solid angle of the TOF analyzer and optimizing the experimental parameters to get optimum energy resolution. Double differential coincidence spectra for a number of materials namely, nearly free electron metals (Al, Si), noble metals (Ag, Au, Cu, W) and highly oriented pyrolytic graphite (HOPG) have been measured using this coincidence spectrometer. The

Secondary electron emission in nanostructured porous silicon

Energy Technology Data Exchange (ETDEWEB)

Ruano, G D; Ferron, J; Koropecki, R R, E-mail: gdruano@ceride.gov.a [INTEC-UNL-CONICET, Gueemes 3450 - 3000 Santa Fe (Argentina)

2009-05-01

We studied the reversible reduction induced by ion bombardment of the secondary electron emission (SEE) yield. This effect has been modelled as due to changes in dynamically sustained dipoles related with ions and electrons penetration ranges. Such charge configuration precludes the escape of electrons from the nanoporous silicon, making the SEE dependent on the flux of impinging ions. Since this dipolar momentum depends on the electric conduction of the porous medium, by controlled oxidation of the nanoporous structure we change the conduction features of the sample, studying the impact on the SEE reduction effect. Li ion bombardment was also used with the intention of changing the parameters determining the effect. FT-IR and Auger electron spectroscopy were used to characterize the oxidation degree of the samples at different depth scales

Secondary electron emission and self-consistent charge transport in semi-insulating samples

Energy Technology Data Exchange (ETDEWEB)

Fitting, H.-J. [Institute of Physics, University of Rostock, Universitaetsplatz 3, D-18051 Rostock (Germany); Touzin, M. [Unite Materiaux et Transformations, UMR CNRS 8207, Universite de Lille 1, F-59655 Villeneuve d' Ascq (France)

2011-08-15

Electron beam induced self-consistent charge transport and secondary electron emission (SEE) in insulators are described by means of an electron-hole flight-drift model (FDM) now extended by a certain intrinsic conductivity (c) and are implemented by an iterative computer simulation. Ballistic secondary electrons (SE) and holes, their attenuation to drifting charge carriers, and their recombination, trapping, and field- and temperature-dependent detrapping are included. As a main result the time dependent ''true'' secondary electron emission rate {delta}(t) released from the target material and based on ballistic electrons and the spatial distributions of currents j(x,t), charges {rho}(x,t), field F(x,t), and potential V(x,t) are obtained where V{sub 0} = V(0,t) presents the surface potential. The intrinsic electronic conductivity limits the charging process and leads to a conduction sample current to the support. In that case the steady-state total SE yield will be fixed below the unit: i.e., {sigma} {eta} + {delta} < 1.

X-ray photoelectron spectroscopy and secondary electron yield analysis of Al and Cu samples exposed to an accelerator environment

Science.gov (United States)

Rosenberg, R. A.; McDowell, M. W.; Ma, Q.; Harkay, K. C.

2003-09-01

It is well known that exposure to an accelerator environment can cause ``conditioning'' of the vacuum chamber surfaces. In order to understand the manner in which the surface structure might influence the production of gases and electrons in the accelerator, such surfaces should be studied both before and after exposure to accelerator conditions. Numerous studies have been performed on representative materials prior to being inserted into an accelerator, but very little has been done on materials that have ``lived'' in the accelerator for extended periods. In the present work, we mounted Al and Cu coupons at different positions in a section of the Advanced Photon Source storage ring and removed them following exposures ranging from 6 to 18 months. X-ray photoelectron spectroscopy (XPS) of the surface was performed before and after exposure. Changes were observed that depended on the location and whether the coupon was facing the chamber interior or chamber wall. These results will be presented and compared to XPS and secondary electron yield data obtained from laboratory measurements meant to simulate the accelerator conditions.

Improved age-diffusion model for low-energy electron transport in solids. II. Application to secondary emission from aluminum

International Nuclear Information System (INIS)

Dubus, A.; Devooght, J.; Dehaes, J.C.

1987-01-01

The ''improved age-diffusion'' model for secondary-electron transport is applied to aluminum. Electron cross sections for inelastic collisions with the free-electron gas using the Lindhard dielectric function and for elastic collisions with the randomly distributed ionic cores are used in the calculations. The most important characteristics of backward secondary-electron emission induced by low-energy electrons on polycrystalline Al targets are calculated and compared to experimental results and to Monte Carlo calculations. The model appears to predict the electronic yield, the energy spectra, and the spatial dependence of secondary emission with reasonable accuracy

Simulation of the electron collection efficiency of a PMT based on the MCP coated with high secondary yield material

Energy Technology Data Exchange (ETDEWEB)

Chen, Lin, E-mail: chenlin@opt.cn [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Graduate School of Chinese Academy of Sciences (CAS), Beijing 100049 (China); Xi' an Jiaotong University, Xi' an 710049 (China); Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006 (China); Tian, Jinshou [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006 (China); Zhao, Tianchi [Institute of High Energy Physics (IHEP) of CAS, Beijing 100049 (China); Liu, Chunliang [Xi' an Jiaotong University, Xi' an 710049 (China); Liu, Hulin; Wei, Yonglin; Sai, Xiaofeng [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Chen, Ping [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Graduate School of Chinese Academy of Sciences (CAS), Beijing 100049 (China); Wang, Xing; Lu, Yu [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Hui, Dandan [State Key Laboratory of Transient Optics and Photonics, Xi' an Institute of Optics and Precision Mechanics (XIOPM), Chinese Academy of Sciences (CAS), Xi' an 710119 (China); Graduate School of Chinese Academy of Sciences (CAS), Beijing 100049 (China)

2016-11-01

Owning to the serious loss of photoelectrons striking at the input electrode of traditional microchannel plate (MCP), photoelectron collection efficiency (CE) of photomultiplier tubes based on MCP (MCP-PMTs) fluctuates around the MCP open area fraction and cannot make a breakthrough. Depositing a thin film of high secondary electron yield material on the MCP is proposed as an effective approach to improve the CE. The available simulation and experimental data to validate it, however, is sparse. In our work, a three-dimensional small area MCP model is developed in CST Studio Suite to evaluate the collection efficiencies of PMTs based on the traditional MCP and the coated one, respectively. Results predict that CE of the PMT based on the coated MCP has a significant increase and a better uniformity, which is expected to reach 100%.

Dependence of secondary electron emission on the incident angle and the energy of primary electrons bombarding bowl-structured beryllium surfaces

International Nuclear Information System (INIS)

Kawata, Jun; Ohya, Kaoru.

1994-01-01

A Monte Carlo simulation of the secondary electron emission from beryllium is combined with a model of bowl structure for surface roughness, for analyzing the difference between the electron emissions for normal and oblique incidences. At normal incidence, with increasing the roughness parameter H/W, the primary energy E pm at which the maximum electron yield occurs becomes higher, and at more than the E pm , the decrease in the yield is slower; where H and W are the depth and width of the bowl structure, respectively. The dispersion of incident angle to the microscopic surface causes a small increase in the yield at oblique incidence, whereas the blocking of primary electrons from bombarding the bottom of the structure causes an opposite trend. The strong anisotropy in the polar angular distribution with respect to the azimuthal angle is calculated at oblique incidence. (author)

Spurious effects of electron emission from the grids of a retarding field analyser on secondary electron emission measurements. Results on a (111) copper single crystal

International Nuclear Information System (INIS)

Pillon, J.; Roptin, D.; Cailler, M.

1976-01-01

Spurious effects of a four grid retarding field analyzer were studied for low energy secondary electron measurements. Their behavior was investigated and two peaks in the energy spectrum were interpreted as resulting from tertiary electrons from the grids. It was shown that the true secondary electron peak has to be separated from these spurious peaks. The spectrum and the yields sigma and eta obtained for a Cu(111) crystal after a surface cleanness control by Auger spectroscopy are given

ROLE OF DIAMOND SECONDARY EMITTERS IN HIGH BRIGHTNESS ELECTRON SOURCES

International Nuclear Information System (INIS)

2005-01-01

In this paper we explore the possibility of using diamond secondary emitter in a high average current electron injector to amplify the current from the photocathode and to isolate the cathode and the injector from each other to increase the life time of the cathode and preserve the performance of the injector. Secondary electron yield of 225 and current density of 0.8 a/cm 2 have been measured in the transmission mode from type 2 a natural diamond. Although the diamond will be heated during normal operation in the injector, calculations indicate that by cryogenically cooling the diamond, the temperature gradient along the diamond can be maintained within the acceptable range. The electron energy and temporal distributions are expected to be narrow from this device resulting in high brightness beams. Plans are underway to measure the SEY in emission mode, fabricate photocathode-diamond capsule and test diamond and capsule in superconducting RF injector

Reduction of Secondary Electron Yied (SEY) Figures on Smooth Metallic Surfaces by Means of Magnetic Roughness

CERN Document Server

Montero, I; Caspers, F; Mensi, M; Taborelli, M

2013-01-01

High secondary electron yield of metallic surfaces used in accelerator and also in space applications is of general concern. In addition to several well-known coating preparation techniques and microscopic or macroscopic mechanical roughness (grooves) which may significantly increase microwave losses the concept of magnetic surface roughness has been proposed recently to lower the effective secondary electron yield (SEY). In this concept a smooth and very good conducting surface with low microwave losses is maintained, but underneath this surface a large number of tiny permanent magnets are located to build a rough magnetic equipotential structure. In this paper we present and discuss measurement of the SEY and the improvement in terms of SEY for different parameter ranges.

Secondary Electron Emission Beam Loss Monitor for LHC

CERN Document Server

Dehning, B; Holzer, E B; Kramer, Daniel

2008-01-01

Beam Loss Monitoring (BLM) system is a vital part of the active protection of the LHC accelerators' elements. It should provide the number of particles lost from the primary hadron beam by measuring the radiation field induced by their interaction with matter surrounding the beam pipe. The LHC BLM system will use ionization chambers as standard detectors but in the areas where very high dose rates are expected, the Secondary Emission Monitor (SEM) chambers will be employed because of their high linearity, low sensitivity and fast response. The SEM needs a high vacuum for proper operation and has to be functional for up to 20 years, therefore all the components were designed according to the UHV requirements and a getter pump was included. The SEM electrodes are made of Ti because of its Secondary Emission Yield (SEY) stability. The sensitivity of the SEM was modeled in Geant4 via the Photo-Absorption Ionization module together with custom parameterization of the very low energy secondary electron production. ...

Secondary electron emission from solid HD and a solid H2-D2 mixture

DEFF Research Database (Denmark)

Sørensen, H.; Børgesen, P.; Hao-Ming, Chen

1983-01-01

Secondary electron emission from solid HD and a solid 0.6 H2 + 0.4 D2 mixture has been studied for electron and hydrogen ion bombardment at primary energies from 0.5 to 3 keV and 2 to 10 keV/amu, respectively. The yield for solid HD is well explained by a simple stoichiometric model of the low...

Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions.

Science.gov (United States)

Zeng, Lixia; Zhou, Xianming; Cheng, Rui; Wang, Xing; Ren, Jieru; Lei, Yu; Ma, Lidong; Zhao, Yongtao; Zhang, Xiaoan; Xu, Zhongfeng

2017-07-25

Secondary electron emission yield from the surface of SiC ceramics induced by Xe 17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463-659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 57% for 3.2 MeV Xe 17+ impact, and about 62% for 4.0 MeV Xe 17+ impact, which is much larger than the decrease observed previously for ion impact at low charged states. The yield dependence on the temperature is discussed in terms of work function, because both kinetic electron emission and potential electron emission are influenced by work function. In addition, our experimental data show that the total electron yield gradually increases with the kinetic energy of projectile, when the target is at a constant temperature higher than room temperature. This result can be explained by electronic stopping power which plays an important role in kinetic electron emission.

Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

Science.gov (United States)

Thompson, William; Stern, Lewis; Ferranti, Dave; Huynh, Chuong; Scipioni, Larry; Notte, John; Sanford, Colin

2010-06-01

Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical and chemical properties and to its surface topography. This SE yield sensitivity is due to the low recoil energy of the HIM initiated electrons and their resulting short mean free path. Additionally, a material's SE escape probability is modulated by changes in the material's work function and surface potential. Due to the escape electrons' roughly 2eV mean energy and their nanometer range mean free path, HIM SE mode image contrast has significant material and surface sensitivity. The latest generation of HIM has a 0.35 nanometer resolution specification and is equipped with a plasma cleaning process to mitigate the effects of hydrocarbon contamination. However, for surfaces that may have native oxide chemistries influencing the secondary electron yield, a new process of low energy, shallow angle argon sputtering, was evaluated. The intent of this work was to study the effect of removing pre-existing native oxides and any in-situ deposited surface contaminants. We will introduce the sputter yield predictions of two established computer models and the sputter yield and sample modification forecasts of the molecular dynamics program, Kalypso. We will review the experimental technique applied to copper samples and show the copper grain contrast improvement that resulted when argon cleaned samples were imaged in HIM SE mode.

Secondary emission electron gun using external primaries

Science.gov (United States)

Srinivasan-Rao, Triveni [Shoreham, NY; Ben-Zvi, Ilan [Setauket, NY

2009-10-13

An electron gun for generating an electron beam is provided, which includes a secondary emitter. The secondary emitter includes a non-contaminating negative-electron-affinity (NEA) material and emitting surface. The gun includes an accelerating region which accelerates the secondaries from the emitting surface. The secondaries are emitted in response to a primary beam generated external to the accelerating region. The accelerating region may include a superconducting radio frequency (RF) cavity, and the gun may be operated in a continuous wave (CW) mode. The secondary emitter includes hydrogenated diamond. A uniform electrically conductive layer is superposed on the emitter to replenish the extracted current, preventing charging of the emitter. An encapsulated secondary emission enhanced cathode device, useful in a superconducting RF cavity, includes a housing for maintaining vacuum, a cathode, e.g., a photocathode, and the non-contaminating NEA secondary emitter with the uniform electrically conductive layer superposed thereon.

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams

NARCIS (Netherlands)

Castaldo, V.; Withagen, J.; Hagen, C.; Kruit, P.; Van Veldhoven, E.

2011-01-01

In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strongly dependent on the surface characteristics, in

Electron Conditioning of Technical Aluminium Surfaces: Effect on the Secondary Electron Yield

Energy Technology Data Exchange (ETDEWEB)

Le Pimpec, F.

2004-12-13

The effect of electron conditioning on commercially aluminium alloys 1100 and 6063 were investigated. Contrary to the assumption that electron conditioning, if performed long enough, can reduce and stabilize the SEY to low values (< 1.3, value of many pure elements [1] ), the SEY of aluminium did not go lower than 1.8. In fact, it reincreases with continued electron exposure dose.

A study on the secondary electrons in a clinical electron beam

International Nuclear Information System (INIS)

Krithivas, G.; Rao, S.N.

1989-01-01

The central axis dose of a 12 MeV clinical electron beam is investigated in terms of an axial component due to primary electrons in the central ray and a lateral component due to secondary electrons originating from multiple scattering of electrons in the off-axis rays. To this effect secondary electron fluence measurements in a polystyrene medium irradiated with a collimated beam are made with a sensitive diode detector. This leads to a construction of secondary electron depth-dose profiles for beam sizes of diameters ranging from 1.7 to 17.4 cm. The results indicate that the lateral electrons account for 25% of the dose in the therapeutic region. For these electrons, the depth of dose maximum is correlated with diffusion depth and maximum lateral excursion in the medium. Dose component due to backscatter electrons at depths is also investigated using a thin-window parallel-plate ion chamber. The role of lateral and backscatter electrons in characterising central axis per cent depth-dose is discussed. (author)

Secondary Electron Emission from Dust and Its Effect on Charging

Science.gov (United States)

Saikia, B. K.; Kakati, B.; Kausik, S. S.; Bandyopadhyay, M.

2011-11-01

Hydrogen plasma is produced in a plasma chamber by striking discharge between incandescent tungsten filaments and the permanent magnetic cage [1], which is grounded. The magnetic cage has a full line cusped magnetic field geometry used to confine the plasma elements. A cylindrical Langmuir probe is used to study the plasma parameters in various discharge conditions. The charge accumulated on the dust particles is calculated using the capacitance model and the dust current is measured by the combination of a Faraday cup and an electrometer at different discharge conditions. It is found Secondary electron emission from dust having low emission yield effects the charging of dust particles in presence of high energetic electrons.

Secondary Electron Emission from Dust and Its Effect on Charging

International Nuclear Information System (INIS)

Saikia, B. K.; Kakati, B.; Kausik, S. S.; Bandyopadhyay, M.

2011-01-01

Hydrogen plasma is produced in a plasma chamber by striking discharge between incandescent tungsten filaments and the permanent magnetic cage [1], which is grounded. The magnetic cage has a full line cusped magnetic field geometry used to confine the plasma elements. A cylindrical Langmuir probe is used to study the plasma parameters in various discharge conditions. The charge accumulated on the dust particles is calculated using the capacitance model and the dust current is measured by the combination of a Faraday cup and an electrometer at different discharge conditions. It is found Secondary electron emission from dust having low emission yield effects the charging of dust particles in presence of high energetic electrons.

Secondary electrons as probe of preequilibrium stopping power of ions penetrating solids

International Nuclear Information System (INIS)

Kroneberger, K.; Rothard, H.; Koschar, P.; Lorenzen, P.; Groeneveld, K.O.; Clouvas, A.; Veje, E.; Kemmler, J.

1990-01-01

The passage of ions through solid media is accompanied by the emission of low energy secondary electrons. At high ion velocities v p (i.e. v p > 10 7 cm/s) the kinetic emission of electrons as a result of direct Coulomb interaction between the ion and the target electron is the dominant initial production mechanism. The energy lost by the ion and, thus, transferred to the electrons is known as electronic stopping power in the solid. Elastic and inelastic interactions of primary, liberated electrons on their way through the bulk and the surface of the solid modify strongly their original energy and angular distribution and, in particular, leads to the transfer of their energy to further, i.e. secondary electrons (SE), such that the main part of the deposited energy of the ion is eventually over transferred to SE. It is, therefore, suggestive to assume a proportionality between the electronic stopping power S sm-bullet of the ion and the total SE yield g, i.e. the number of electrons ejected per ion. Following Sternglass the authors consider schematically for kinetic SE emission contributions from two extreme cases: (a) SEs produced mostly isotropically with large impact parameter, associated with an escape depth L SE from the solid; (b) SEs produced mostly unisotropically in forward direction with small impact parameter (δ-electrons), associated with a transport length L δ

Secondary electron emission influenced by oxidation on the aluminum surface: the roles of the chemisorbed oxygen and the oxide layer

Science.gov (United States)

Li, Jiangtao; Hoekstra, Bart; Wang, Zhen-Bin; Qiu, Jie; Pu, Yi-Kang

2018-04-01

A relationship between the apparent secondary electron yield ({γ }{{se}}) and the oxygen coverage/oxide layer thickness on an aluminum cathode is obtained in an experiment under a controlled environment. The apparent secondary electron yield ({γ }{{se}}) is deduced from the breakdown voltage between two parallel plate electrodes in a 360 mTorr argon environment using a simple Townsend breakdown model with the assumption that the variation of the apparent secondary electron yield is dominated by the variation of the argon ion induced processes. The oxygen coverage/oxide layer thickness on the aluminum cathode is measured by a semi in situ x-ray photoemission spectroscopy equipment which is directly attached to the discharge chamber. It is found that three phases exist: (1) in the monomonolayer regime, as the oxygen coverage increases from 0 to 0.3, {γ }{{se}} decreases by nearly 40 % , (2) as the oxygen coverage increases from 0.3 to 1, {γ }{{se}} keeps nearly constant, (3) as the oxide layer thickness increases from about 0.3 nm to about 1.1 nm, {γ }{{se}} increases by 150 % . We propose that, in the submonolayer regime, the chemisorbed oxygen on the aluminum surface causes the decrease of {γ }{{se}} by creating a local potential barrier, which reduces the Auger neutralization rate and the energy gained by the Auger electrons. In the multilayer regime, as the oxide layer grows in thickness, there are three proposed mechanisms which cause the increase of {γ }{{se}}: (1) the work function decreases; (2) resonance neutralization and Auger de-excitation may exist. This is served as another channel for secondary electron production; (3) the kinetic energy of Auger electrons is increased on average, leading to a higher probability for electrons to overcome the surface potential barrier.

Basic aspects of secondary electron distributions

International Nuclear Information System (INIS)

Kim, Y.K.

1975-07-01

Graphical methods proposed by Platzman and by Fano are applied to the analysis of the basic features observed in secondary electron spectra. These methods are useful not only in checking the consistency of experimental data, but also in extrapolating the spectra to the range of primary- and secondary-electron energies not covered by experiments. Illustrative examples are presented for He, Ne, and NO. (U.S.)

Secondary electron emission anisotropy in oblique incidence of electrons on the (100) Mo

International Nuclear Information System (INIS)

Gomoyunova, M.V.; Zaslavskij, S.L.; Pronin, I.I.

1978-01-01

Studied was the influence of azimuthal plane of incidence of primary particles with energies of 0.5-1.5 keV on the secondary electron emission of the (100) Mo face at the constant polar angle of 45 deg. The measurements were carried out in vacuum of (2-4)x10 -10 torr by modulation technique. It is shown that anisotropy is peculiar to the secondary electron emission of all energies. The anisotropy of emission has two maxima; the high-energy maximum connected with reflected primary electrons and situated near the elastically reflected electrons and weaker pronounced the low-energy one which is found at energies of 100-200 eV and is conditioned by truly secondary electrons. It is shown that the anisotropy, characterizing secondary electrons responsible for the appearance of structure in spectrum, particularly the Auger electrons and the electrons suffering ionizing energy losses, exceeds the anisotropy of continuous spectrum electrons possessing the same energy. The electron diffraction dynamic theory, based on the conception of the united wave field of electrons, has been used to explain the regularities stated

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Science.gov (United States)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-01

Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An ;equivalent work function; is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called ;work function; (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Unified model of secondary electron cascades in diamond

International Nuclear Information System (INIS)

Ziaja, Beata; London, Richard A.; Hajdu, Janos

2005-01-01

In this article we present a detailed and unified theoretical treatment of secondary electron cascades that follow the absorption of x-ray photons. A Monte Carlo model has been constructed that treats in detail the evolution of electron cascades induced by photoelectrons and by Auger electrons following inner shell ionizations. Detailed calculations are presented for cascades initiated by electron energies between 0.1 and 10 keV. The present article expands our earlier work [B. Ziaja, D. van der Spoel, A. Szoeke, and J. Hajdu, Phys. Rev. B 64, 214104 (2001), Phys. Rev. B 66, 024116 (2002)] by extending the primary energy range, by improving the treatment of secondary electrons, especially at low electron energies, by including ionization by holes, and by taking into account their coupling to the crystal lattice. The calculations describe the three-dimensional evolution of the electron cloud, and monitor the equivalent instantaneous temperature of the free electron gas as the system cools. The dissipation of the impact energy proceeds predominantly through the production of secondary electrons whose energies are comparable to the binding energies of the valence (40-50 eV) and of the core electrons (300 eV). The electron cloud generated by a 10 keV electron is strongly anisotropic in the early phases of the cascade (t≤1 fs). At later times, the sample is dominated by low energy electrons, and these are scattered more isotropically by atoms in the sample. Our results for the total number of secondary electrons agree with available experimental data, and show that the emission of secondary electrons approaches saturation within about 100 fs following the primary impact

Beam-ripple monitor with secondary electrons

International Nuclear Information System (INIS)

Sato, Shinji; Kanazawa, Mitsutaka; Noda, Koji; Takada, Eiichi; Komiyama, Akihito; Ichinohe, Ken-ichi; Sano, Yoshinobu

1997-01-01

To replace the scintillation-ripple monitor, we have developed a new monitor with a smaller destructive effect on the beam. In this monitor, we use secondary electrons emitted from an aluminum foil with a thickness of 2 μm. The signals of secondary electrons are amplified by an electron multiplier having a maximum gain of 10 6 . By using the new monitor, we could clearly observe the beam ripple with a beam intensity of 3.6x10 8 pps (particle per second). This monitor can also be used as an intensity monitor in the range of 10 4 - 10 9 pps. (author)

Electronic excitation effects on secondary ion emission in highly charged ion-solid interaction

International Nuclear Information System (INIS)

Sekioka, T.; Terasawa, M.; Mitamura, T.; Stoeckli, M.P.; Lehnert, U.; Fehrenbach, C.

2001-01-01

In order to investigate the secondary ion emission from the surface of conductive materials bombarded by highly charged heavy ions, we have done two types of experiments. First, we have measured the yield of the sputtered ions from the surface of solid targets of conductive materials (Al, Si, Ni, Cu) bombarded by Xe q+ (q=15-44) at 300 keV (v p =0.30 a.u) and at 1.0 MeV (v p =0.54 a.u). In view of the secondary ion yields as a function of the potential energy of the projectile, the increase rates below q=35, where the potential energy amounts to 25.5 keV, were rather moderate and showed a prominent increase above q=35. These phenomena were rather strong in the case of the metal targets. Second, we have measured the energy dependence of the yield of the sputtered ions from the surface of solid targets of conductive materials (C, Al) bombarded by Xe q+ (q=30,36,44) between 76 keV (v p =0.15 a.u) and 6.0 MeV (v p =1.3 a.u). A broad enhancement of the secondary ion yield has been found for Al target bombarded by Xe 44+ . From these experimental results, the electronic excitation effects in conductive materials for impact of slow highly charged heavy ions bearing high potential energy is discussed

Note: Self-biased voltage to suppress secondary electrons by a ZnO varistor in a compact pulsed neutron generator

Science.gov (United States)

Yang, Z.; Li, X.; Li, J.; Long, J. D.; Lan, C. H.; Wang, T.; Dong, P.; He, J. L.

2017-03-01

A large amount of back streaming electrons will bring about a part of current drain on power supply, cause sparking or high-voltage breakdowns, and affect the neutron yield and waveform for a compact sealed-tube pulsed neutron generator. A novel idea which uses a ZnO varistor to provide a constant self-biased voltage to suppress the secondary electrons is introduced. The I-V curve for the ZnO varistor was measured in the experiment. The effects of suppressing the secondary electrons were investigated using a ZnO varistor, linear resistors, and an independent power supply, respectively. The results show that the secondary electrons are suppressed effectively by the compact ZnO varistor, while not increasing the size and the component of the device. It is a promising design for compact sealed-tube neutron generators.

Secondary electron radiation from different targets exposed to photons with energy 0.1 to 3 MeV

International Nuclear Information System (INIS)

Akkerman, A.F.; Botvin, V.A.; Chernov, G.Ya.

1982-01-01

Differential and integral yields of secondary electrons from different targets bombarded by monoenergetic photon beams are calculated using the Monte Carlo method. The results are compared to experimental data and values calculated by other authors. The discovered 20 to 30% decrease of calculated backward yields according to experimental data for heavy elements is explained by the limited applicability of Sauter's formula for the description of photoelectron angular distribution. (author)

Comparison of secondary ion emission yields for poly-tyrosine between cluster and heavy ion impacts

International Nuclear Information System (INIS)

Hirata, K.; Saitoh, Y.; Chiba, A.; Yamada, K.; Takahashi, Y.; Narumi, K.

2010-01-01

Emission yields of secondary ions necessary for the identification of poly-tyrosine were compared for incident ion impacts of energetic cluster ions (0.8 MeV C 8 + , 2.4 MeV C 8 + , and 4.0 MeV C 8 + ) and swift heavy monoatomic molybdenum ions (4.0 MeV Mo + and 14 MeV Mo 4+ ) with similar mass to that of the cluster by time-of-flight secondary ion mass analysis combined with secondary ion electric current measurements. The comparison revealed that (1) secondary ion emission yields per C 8 + impact increase with increasing incident energy within the energy range examined, (2) the 4.0 MeV C 8 + impact provides higher emission yields than the impact of the monoatomic Mo ion with the same incident energy (4.0 MeV Mo + ), and (3) the 2.4 MeV C 8 + impact exhibits comparable emission yields to that for the Mo ion impact with higher incident energy (14 MeV Mo 4+ ). Energetic cluster ion impacts effectively produce the characteristic secondary ions for poly-tyrosine, which is advantageous for highly sensitive amino acid detection in proteins using time-of-flight secondary ion mass analysis.

Dependence of secondary electron emission on surface charging in sapphire and polycrystalline alumina: Evaluation of the effective cross sections for recombination and trapping

International Nuclear Information System (INIS)

Said, K.; Damamme, G.; Si Ahmed, A.; Moya, G.; Kallel, A.

2014-01-01

Highlights: • A novel approach for the analysis of the secondary electron emission in connection with the surface density of trapped charges. • Experimental estimation of the effective cross section for electron–hole recombination and electron trapping in defects. • A simplified charge transport and trapping model which corroborates qualitatively the interpretation of the results. - Abstract: The evolution of the secondary electron emission from sapphire and polycrystalline alumina during electron irradiation, achieved in a scanning electron microscope at room temperature, is derived from the measurement of the induced and the secondary electron currents. The semi-logarithmic plot of the secondary electron emission yield versus the surface density of trapped charges displays a plateau followed by a linear variation. For positive charging, the slope of the linear part, whose value is of about 10 −9 cm 2 , is independent of the primary electron energy, the microstructure and the impurities. It is interpreted as an effective microscopic cross section for electron–hole recombination. For negative charging of sapphire, the slope is associated with an effective electron trapping cross section close to 10 −11 cm 2 , which can be assigned to the dominant impurity trap. These effective values reflect the multiple interactions leading to the accumulation of charges. The yield corresponding to the plateau is controlled by the initial density of impurity traps. A charge transport and trapping >model, based on simplifying assumptions, confirms qualitatively these inferences

Secondary-electron-emission spectroscopy of tungsten: Angular dependence and phenomenology

DEFF Research Database (Denmark)

Willis, Roy F.; Christensen, Niels Egede

1978-01-01

spectra from (100), (110), and (111) tungsten surfaces has been studied as a function of polar angle 0°≲Θ≲70° along azimuthal directions φ such that the energy- and angle-resolved SEE current jSEE (E, Ω) effectively scans states throughout the 1 / 48th irreducible body-centered-cubic zone. Calculations...... have been carried out in both "reduced" and "extended" K→ space in order to assess the relative contribution of elastic umklapp scattering to the density distribution of contributing states profiles. The results indicate that the overall secondary-electron yield may be represented as the sum...

On the spectrum of the secondary auroral electrons

International Nuclear Information System (INIS)

Fung, S.F.; Hoffman, R.A.

1988-01-01

We present the results from a statistical study of the spectral characteristics of the (power law portion) secondary electrons associated with inverted-V electron precipitation events. A total of 106 inverted-V events observed at low altitudes ( - /sup γ/ with an averaged γ = 1.85. This spectral parameter is relatively insensitive to the variation of locations of the inverted-V events, but it depends on the primary beam parameters. We compare our results with the predictions and assess the applicabilities of the current theories on the generation of the low-energy auroral power law secondary electrons. Our analysis shows that collisional processes are the dominant source of the secondary electrons. copyright American Geophysical Union 1988

Mechanism of enhancement of controllable secondary-electron emission from fast single electrons

International Nuclear Information System (INIS)

Lorikyan, M.P.; Kavalov, R.L.; Trofimchuk, N.N.; Arvanov, A.N.; Gavalyan, V.G.

For porous KCl films (density approximately 2 percent, thickness 50-400 μm), the controllable secondary electron emission (CSEE) from fast single electrons with energies of 0.7-2 MeV was studied. An electric field E of approximately 10 4 -10 5 V/cm was set up inside the porous films and the emission curves anti sigma = f(E) and the energy spectra of the secondary electrons were measured. The mean emission coefficient anti sigma increases with increasing E, reaching a value of anti sigma approximately equal to 230. Internal enhancement of CSEE under the action of the E field is explained by a process similar to the Townsend semi-self-maintained discharge in gases. The mean free path L/sub e/ of the secondary electrons estimated on the basis of this mechanism of CSEE enhancement is in good agreement with the L/sub e/ value obtained independently from the energy spectra of the secondary electrons. The report examines the effect of the first critical potential U/sub il/ and of the electron affinity of the dielectric α on the formation of CSEE from a porous dielectric film. The possibility of using such films in particle detectors is discussed

Comparison of the secondary electrons produced by proton and electron beams in water

Energy Technology Data Exchange (ETDEWEB)

Kia, Mohammad Reza, E-mail: m-r-kia@aut.ac.ir; Noshad, Houshyar [Department of Energy Engineering and Physics, Amirkabir University of Technology (Tehran Polytechnic), P.O. Box 15875-4413, Hafez Avenue, Tehran (Iran, Islamic Republic of)

2016-05-15

The secondary electrons produced in water by electron and proton beams are compared with each other. The total ionization cross section (TICS) for an electron impact in water is obtained by using the binary-encounter-Bethe model. Hence, an empirical equation based on two adjustable fitting parameters is presented to determine the TICS for proton impact in media. In order to calculate the projectile trajectory, a set of stochastic differential equations based on the inelastic collision, elastic scattering, and bremsstrahlung emission are used. In accordance with the projectile trajectory, the depth dose deposition, electron energy loss distribution in a certain depth, and secondary electrons produced in water are calculated. The obtained results for the depth dose deposition and energy loss distribution in certain depth for electron and proton beams with various incident energies in media are in excellent agreement with the reported experimental data. The difference between the profiles for the depth dose deposition and production of secondary electrons for a proton beam can be ignored approximately. But, these profiles for an electron beam are completely different due to the effect of elastic scattering on electron trajectory.

Average L-shell fluorescence, Auger, and electron yields

International Nuclear Information System (INIS)

Krause, M.O.

1980-01-01

The dependence of the average L-shell fluorescence and Auger yields on the initial vacancy distribution is shown to be small. By contrast, the average electron yield pertaining to both Auger and Coster-Kronig transitions is shown to display a strong dependence. Numerical examples are given on the basis of Krause's evaluation of subshell radiative and radiationless yields. Average yields are calculated for widely differing vacancy distributions and are intercompared graphically for 40 3 subshell yields in most cases of inner-shell ionization

Assessing the role of secondary electron emission on the characteristics of 6-cavity magnetrons with transparent cathode through particle-in-cell simulations

Energy Technology Data Exchange (ETDEWEB)

Qiu, Hao; Joshi, Ravi P., E-mail: rjoshi@odu.edu [Department of Electrical and Computer Engineering, Old Dominion University, Norfolk, Virginia 23529-0246 (United States); Prasad, Sarita; Schamiloglu, Edl [Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87131-0001 (United States); Ludeking, Lars [ATK Mission Systems, 8560 Cinderbed Road, Suite 700, Newington, Virginia 22122 (United States)

2014-05-21

Effects of secondary electron emission (SEE) on the performance of a 6-cavity relativistic magnetron with transparent cathodes are probed through particle-in-cell simulations. Appropriate relations for the secondary electron yield have been developed and used. For comparisons, separate simulations have been performed with- and without electron cascading. Simulation results seem to indicate SEE to be detrimental to the power output due to deviations in the starting trajectories of secondary electrons, and the reduced fraction with synchronized rotational velocity. A higher reduction in output power is predicted with electron cascading, though mode competition was not seen at the 0.65 T field. A possible solution to mitigating SEE in magnetrons for high power microwave applications would be to alter the surface properties of emitting electrodes through irradiation, which can lead to graphitic film formation.

Paradoxes of photoconductive target and optical control of secondary ion yield

International Nuclear Information System (INIS)

Rokakh, A. G.; Matasov, M. D.

2010-01-01

This study of the photoconductivity of semiconductors, in particular, cadmium chalcogenides as materials for targets of vacuum image converters followed the path of overcoming paradoxes. The concepts developed by the classics of photoelectricity also help to understand the paradoxes of the new secondary-ion photoelectric effect, especially, its spectral characteristic. The optical channel of secondary ion yield control via a photoconductive target opens the way to a new branch of nanotechnology, i.e., optoionics.

Secondary electron images obtained with a standard PEEM set up

International Nuclear Information System (INIS)

Benka, O.; Zeppenfeld, P.

2004-01-01

Secondary electron images excited by 3 to 4.3 keV electrons are obtained with a standard photoelectron electron emission microscope (PEEM) set up equipped with an imaging energy filter (IEF). The electron gun was mounted on a standard PEEM entrance flange at an angle of 25 o with respect to the sample surface. A low extraction voltage of 500 V was used to minimize the deflection of the electron beam by the PEEM extraction electrode. The secondary electron images are compared to photoelectron images excited by a standard 4.9 eV UV lamp. In the case of a Cu pattern on a Si substrate it is found that the lateral resolution without the IEF is about the same for electron and photon excitation but that the relative electron emission intensities are very different. The use of the IEF-reduces the lateral resolution. Images for secondary electron energies between eV 1 and eV 2 were obtained by setting the IEF to -V 1 and -V 2 ∼ -(V 1 + 5V) potentials and taking the difference of both images. Images up to 100 eV electron energies were recorded. The lateral resolution is in the range of μm. The material contrast obtained in these difference images are discussed in terms of a secondary electron and photoelectron emission model and secondary electron energy spectra measured with a LEED-Auger spectrometer. (author)

Surface characterization by energy distribution measurements of secondary electrons and of ion-induced electrons

International Nuclear Information System (INIS)

Bauer, H.E.; Seiler, H.

1988-01-01

Instruments for surface microanalysis (e.g. scanning electron or ion microprobes, emission electron or ion microscopes) use the current of emitted secondary electrons or of emitted ion-induced electrons for imaging of the analysed surface. These currents, integrating over all energies of the emitted low energy electrons, are however, not well suited to surface analytical purposes. On the contrary, the energy distribution of these electrons is extremely surface-sensitive with respect to shape, size, width, most probable energy, and cut-off energy. The energy distribution measurements were performed with a cylindrical mirror analyser and converted into N(E), if necessary. Presented are energy spectra of electrons released by electrons and argon ions of some contaminated and sputter cleaned metals, the change of the secondary electron energy distribution from oxidized aluminium to clean aluminium, and the change of the cut-off energy due to work function change of oxidized aluminium, and of a silver layer on a platinum sample. The energy distribution of the secondary electrons often shows detailed structures, probably due to low-energy Auger electrons, and is broader than the energy distribution of ion-induced electrons of the same object point. (author)

Determination of low-energy ion-induced electron yields from thin carbon foils

International Nuclear Information System (INIS)

Allegrini, Frederic; Wimmer-Schweingruber, Robert F.; Wurz, Peter; Bochsler, Peter

2003-01-01

Ion beams crossing thin carbon foils can cause electron emission from the entrance and exit surface. Thin carbon foils are used in various types of time-of-flight (TOF) mass spectrometers to produce start pulses for TOF measurements. The yield of emitted electrons depends, among other parameters, on the energy of the incoming ion and its mass, and it has been experimentally determined for a few projectile elements. The electron emission yield is of great importance for deriving abundance ratios of elements and isotopes in space plasmas using TOF mass spectrometers. We have developed a detector for measuring ion-induced electron yields, and we have extended the electron yield measurements for oxygen to energies relevant for solar wind research. We also present first measurements of the carbon foil electron emission yield for argon and iron in the solar wind energy range

Disruption generated secondary runaway electrons in present day tokamaks

International Nuclear Information System (INIS)

Pankratov, I.M.; Jaspers, R.

2000-01-01

An analysis of the runaway electron secondary generation during disruptions in present day tokamaks (JET, JT-60U, TEXTOR) was made. It was shown that even for tokamaks with the plasma current I approx 100 kA the secondary generation may dominate the runaway production during disruptions. In the same time in tokamaks with I approx 1 MA the runaway electron secondary generation during disruptions may be suppressed

Secondary-electron cascade in attosecond photoelectron spectroscopy from metals

DEFF Research Database (Denmark)

Baggesen, Jan Conrad; Madsen, Lars Bojer

2009-01-01

an analytical model based on an approximate solution to Boltzmann's transport equation to account for the amount and energy distribution of these secondary electrons. Our theory is in good agreement with the electron spectrum found in a recent attosecond streaking experiment. To suppress the background and gain......Attosecond spectroscopy is currently restricted to photon energies around 100 eV. We show that under these conditions, electron-electron scatterings, as the photoelectrons leave the metal, give rise to a tail of secondary electrons with lower energies and hence a significant background. We develop...

Development of an X-ray installation for the study of secondary electrons: preliminary measurements and calculations

International Nuclear Information System (INIS)

Baguena, A.; Shaw, M.; Williart, A.; Baguena, A.; Garcia, G.

2006-01-01

We describe the calculations and preliminary measures made for the installation of a X-ray generator tube. This device is going to be used for the secondary electron production from photonic primary radiation of up to 125 keV. With this experimental system, we will study the energetic and space distribution of produced secondary electrons by obtaining its spectrum of energies and its angular distribution. This method of measurement is going to be applied in different targets of radiological, environmental and biological interest. Calculations in the present article include: theoretical yield of X-rays production of the designed equipment, necessary shielding for the radiological safety of the installation staff, and an estimated dose due to their use. Characteristics of the installation and the equipment are described with this purpose. (author)

Development of an X-ray installation for the study of secondary electrons: preliminary measurements and calculations

Energy Technology Data Exchange (ETDEWEB)

Baguena, A.; Shaw, M.; Williart, A. [Universidad Nacional de Educacion a Distancia, Dpto. Fisica de los Materiales, Madrid (Spain); Baguena, A. [Consejo de Seguridad Nuclear, Madrid (Spain); Garcia, G. [Instituto de Matematicas y Fisica Fundamental, Consejo Superior de Investigaciones Cientificas, Madrid (Spain)

2006-07-01

We describe the calculations and preliminary measures made for the installation of a X-ray generator tube. This device is going to be used for the secondary electron production from photonic primary radiation of up to 125 keV. With this experimental system, we will study the energetic and space distribution of produced secondary electrons by obtaining its spectrum of energies and its angular distribution. This method of measurement is going to be applied in different targets of radiological, environmental and biological interest. Calculations in the present article include: theoretical yield of X-rays production of the designed equipment, necessary shielding for the radiological safety of the installation staff, and an estimated dose due to their use. Characteristics of the installation and the equipment are described with this purpose. (author)

Recent studies on photoelectron and secondary electron yields of TiN and NEG coatings using the KEKB positron ring

International Nuclear Information System (INIS)

Suetsugu, Y.; Kanazawa, K.; Shibata, K.; Hisamatsu, H.

2007-01-01

In order to obtain a method to suppress electron-cloud instability (ECI), the photoelectron and the secondary electron yields (PEY and SEY) of a TiN coating and an NEG (Ti-Zr-V) coating on copper have been studied so far by using the KEK B-factory (KEKB) positron ring. Recently, test chambers with these coatings were installed at a straight section of the ring where the irradiated photon density was considerably smaller than that at the arc section of a previous experiment. The number of electrons around beams was measured by an electron current monitor; this measurement was performed up to a stored beam current of approximately 1700 mA (1389 bunches). For the entire range of the beam current, the electron currents of the NEG-coated and the TiN-coated chambers were clearly smaller as compared to those of the uncoated copper chamber by the factors of 2-3 and 3-4, respectively. The small photon density, that is, the weak effect of photoelectrons, elucidated the differences in the SEYs of these coatings when compared to the measurements at the arc section. By assuming almost the same PEY (η e ) values obtained in the previous study, the maximum SEY (δ max ) for the TiN and NEG coatings and the copper chamber was again estimated based on a previously developed simulation. The evaluated δ max values for these three surfaces were in the ranges of 0.8-1.0, 1.0-1.15, and 1.1-1.25, respectively. These values were consistent with the values obtained so far. As an application of the simulation, the effective η e , η e-eff (which included the geometrical effect of the antechamber) and δ max values were also estimated for copper chambers with one or two antechambers. These chambers were installed in an arc section and a wiggler section, respectively. The evaluated η e-eff and δ max values were approximately 0.008 and 1.2, and 0.04 and 1.2, respectively, where η e =0.28 was assumed on the side wall. As expected, the η e-eff values were considerably smaller than those

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Energy Technology Data Exchange (ETDEWEB)

Yang, Jing; Cui, Wanzhao, E-mail: cuiwanzhao@126.com; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-30

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Investigation of argon ion sputtering on the secondary electron emission from gold samples

International Nuclear Information System (INIS)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-01-01

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

[Effect of different fertilization treatments on yield and secondary metabolites of Codonopsis pilosula].

Science.gov (United States)

Hu, Jia-Dong; Mao, Ge; Zhang, Zhi-Wei; Ma, Cun-de; Liang, Zong-Suo; Xia, Guang-Dong; Dong, Juan-E

2017-08-01

The research studies the effect of different fertilization treatments on yield and accumulation of secondary metabolites of Codonopsis pilosula by using single factor randomized block design, in order to ensure reasonable harvesting time and fertilization ratio, and provide the basis for standardized cultivation of C. pilosula. According to the clustering results, the nitrogen fertilizer benefitted for the improvement of root diameter and biomass of C. pilosula. The phosphate fertilizer could promote the content of C. pilosula polysaccharide. The organic fertilizers could increase the content of lobetyolin. With the time going on, C. pilosula's yield, polysaccharide and ehanol-soluble extracts increased while the content of lobetyolin decreased. According to various factors, October is a more reasonable harvest period. Organic fertilizers are more helpful to the yield and accumulation of secondary metabolites of C. pilosula. Copyright© by the Chinese Pharmaceutical Association.

The role of secondary electrons in some experiments determining fluorescence emission from nitrogen C3Πu levels

International Nuclear Information System (INIS)

Blanco, F.; Arqueros, F.

2005-01-01

The processes involved in fluorescence emission from C 3 Π u levels of N 2 molecule by electron impact are studied. Secondary electrons are shown to play an important role in typical experiments for the measurement of emission cross sections and fluorescence yields, dominating at high impact energies. A simple model is proposed which accounts for fluorescence measurements in a wide range of experimental conditions, and in particular for some recent results up to 1 GeV energies

Secondary Electrons as an Energy Source for Life

Science.gov (United States)

Stelmach, Kamil B.; Neveu, Marc; Vick-Majors, Trista J.; Mickol, Rebecca L.; Chou, Luoth; Webster, Kevin D.; Tilley, Matt; Zacchei, Federica; Escudero, Cristina; Flores Martinez, Claudio L.; Labrado, Amanda; Fernández, Enrique J. G.

2018-01-01

Life on Earth is found in a wide range of environments as long as the basic requirements of a liquid solvent, a nutrient source, and free energy are met. Previous hypotheses have speculated how extraterrestrial microbial life may function, among them that particle radiation might power living cells indirectly through radiolytic products. On Earth, so-called electrophilic organisms can harness electron flow from an extracellular cathode to build biomolecules. Here, we describe two hypothetical mechanisms, termed "direct electrophy" and "indirect electrophy" or "fluorosynthesis," by which organisms could harness extracellular free electrons to synthesize organic matter, thus expanding the ensemble of potential habitats in which extraterrestrial organisms might be found in the Solar System and beyond. The first mechanism involves the direct flow of secondary electrons from particle radiation to a microbial cell to power the organism. The second involves the indirect utilization of impinging secondary electrons and a fluorescing molecule, either biotic or abiotic in origin, to drive photosynthesis. Both mechanisms involve the attenuation of an incoming particle's energy to create low-energy secondary electrons. The validity of the hypotheses is assessed through simple calculations showing the biomass density attainable from the energy supplied. Also discussed are potential survival strategies that could be used by organisms living in possible habitats with a plentiful supply of secondary electrons, such as near the surface of an icy moon. While we acknowledge that the only definitive test for the hypothesis is to collect specimens, we also describe experiments or terrestrial observations that could support or nullify the hypotheses.

Secondary Electrons as an Energy Source for Life.

Science.gov (United States)

Stelmach, Kamil B; Neveu, Marc; Vick-Majors, Trista J; Mickol, Rebecca L; Chou, Luoth; Webster, Kevin D; Tilley, Matt; Zacchei, Federica; Escudero, Cristina; Flores Martinez, Claudio L; Labrado, Amanda; Fernández, Enrique J G

2018-01-01

Life on Earth is found in a wide range of environments as long as the basic requirements of a liquid solvent, a nutrient source, and free energy are met. Previous hypotheses have speculated how extraterrestrial microbial life may function, among them that particle radiation might power living cells indirectly through radiolytic products. On Earth, so-called electrophilic organisms can harness electron flow from an extracellular cathode to build biomolecules. Here, we describe two hypothetical mechanisms, termed "direct electrophy" and "indirect electrophy" or "fluorosynthesis," by which organisms could harness extracellular free electrons to synthesize organic matter, thus expanding the ensemble of potential habitats in which extraterrestrial organisms might be found in the Solar System and beyond. The first mechanism involves the direct flow of secondary electrons from particle radiation to a microbial cell to power the organism. The second involves the indirect utilization of impinging secondary electrons and a fluorescing molecule, either biotic or abiotic in origin, to drive photosynthesis. Both mechanisms involve the attenuation of an incoming particle's energy to create low-energy secondary electrons. The validity of the hypotheses is assessed through simple calculations showing the biomass density attainable from the energy supplied. Also discussed are potential survival strategies that could be used by organisms living in possible habitats with a plentiful supply of secondary electrons, such as near the surface of an icy moon. While we acknowledge that the only definitive test for the hypothesis is to collect specimens, we also describe experiments or terrestrial observations that could support or nullify the hypotheses. Key Words: Radiation-Electrophiles-Subsurface life. Astrobiology 18, 73-85.

An experimental assessment of methods used to compute secondary electron emission yield for tungsten and molybdenum electrodes based on exposure to Alcator C-Mod scrape-off layer plasmas

Science.gov (United States)

McCarthy, W.; LaBombard, B.; Brunner, D.; Kuang, A. Q.

2018-03-01

Plasma potentials computed from Langmuir probe data rely on a method to account for secondary electron emission (SEE) from the electrodes. However, significant variations exist among published models for SEE and the reported experimental parameters used to evaluate them. As a means to critically assess SEE computation methods, two of four tungsten electrodes on a Langmuir-Mach probe head were replaced with molybdenum and exposed to Alcator C-Mod boundary plasmas where electron temperatures exceed 50 eV and SEE becomes significant. In this situation, plasma potentials computed for either material should be identical—the SEE evaluation method should properly account for the differences in SEE yields. Of the six methods used to compute SEE, two are found to produce consistent results (Sternglass model with Bronstein experimental parameters and Young-Dekker model with Bronstein experimental parameters). In contrast, the method previously used for C-Mod data analysis (Sternglass model with Kollath parameters) was found to be inconsistent. We have since adopted Young-Dekker-Bronstein as the preferred method.

Secondary electron emission from Au by medium energy atomic and molecular ions

CERN Document Server

Itoh, A; Obata, F; Hamamoto, Y; Yogo, A

2002-01-01

Number distributions of secondary electrons emitted from a Au metal surface have been measured for atomic and molecular ions of H sup + , He sup + , C sup + , N sup + , O sup + , H sup + sub 2 , H sup + sub 3 , HeH sup + , CO sup + and O sup + sub 2 in the energy range 0.3-2.0 MeV. The emission statistics obtained are described fairly well by a Polya function. The Polya parameter b, determining the distribution shape, is found to decrease monotonously with increasing emission yield gamma, revealing a surprising relationship of b gamma approx 1 over the different projectile species and impact energies. This finding supports certainly the electron cascading model. Also we find a strong negative molecular effect for heavier molecular ions, showing a significant reduction of gamma compared to the estimated values using constituent atomic projectile data.

Construction of electron accelerator for studying secondary emission in dielectric materials

International Nuclear Information System (INIS)

Hessel, R.

1990-01-01

An acelerator for the generation of low energy electrons (in the 0.4 to 20 keV range) was constructed. The accelerator is equipped with some devices especially designed for the investigation of the electrical properties of electron-irradiated dielectrics. In this work we have employed it for the study of the secondary electron emission of irradiated polymers. Reference is made to a method proposed by H. von Seggern (IEEE Trans. Nucl. Sci. NS-32, p.1503 (1985)] which was intended for the determination of the electron emission yield especially between the two cross-over points in a single run, here called the dynamical method. We have been able to prove that, contrary to expectation, this method does not give correct results over the entire emission curve. Rather it gives yield values which are too low by 25% in the region where the emission exhibits a maximum, due to the interaction between the electron emission process and the positive surface charge of the dielectric. However the method needs not to be dismissed entirely. As it is, it can be used advantageously for the precise determination of the energy of the second cross-over point. In addition, with the same set up, the method could be improved by replacing the continuous irradiation of the sample by a pulsed irradiation, leading to results essentially the same as those shown in the literature. Finally analysing the process of interaction between the positive charge of the dielectric and the mechanism of electron emission in several situations, we were able: I) to determine the maximum value and the average value of the escape depth of the emitted electrons; II) for a sample with a net positive charge, to show that the positive charge resides very near the surface of incidence; III) for a sample with a net negative charge, to show that the positive charge also resides near the surface while the (prevalent) negative charge resides in the bulk of the material. (author)

Ionizing device comprising a microchannel electron multiplier with secondary electron emission

International Nuclear Information System (INIS)

Chalmeton, Vincent.

1974-01-01

The present invention relates to a ionizing device comprising a microchannel electron multiplier involving secondary electron emission as a means of ionization. A system of electrodes is used to accelerate said electrons, ionize the gas and extract the ions from thus created plasma. Said ionizer is suitable for bombarding the target in neutron sources (target of the type of nickel molybdenum coated with tritiated titanium or with a tritium deuterium mixture) [fr

Very High Radiation Detector for the LHC BLM System Based on Secondary Electron Emission

CERN Document Server

Dehning, B; Holzer, EB; Kramer, D

2007-01-01

Beam Loss Monitoring (BLM) system plays a vital role in the active protection of the LHC accelerators elements. It should provide the number of particles lost from the primary hadron beam by measuring the radiation field induced by their interaction with matter surrounding the beam pipe. The LHC BLM system will use ionization chambers as standard detectors but in the areas where very high dose rates are expected, the Secondary Emission Monitor (SEM) chambers will be employed because of their high linearity, low sensitivity and fast response. The SEM needs a high vacuum for proper operation and has to be functional for up to 20 years, therefore all the components were designed according to the UHV requirements and a getter pump was included. The SEM electrodes are made of Ti because of its Secondary Emission Yield (SEY) stability. The sensitivity of the SEM was modeled in Geant4 via the Photo-Absorption Ionization module together with custom parameterization of the very low energy secondary electron production...

SECONDARY EMISSION FROM NON-SPHERICAL DUST GRAINS WITH ROUGH SURFACES: APPLICATION TO LUNAR DUST

International Nuclear Information System (INIS)

Richterová, I.; Němeček, Z.; Beránek, M.; Šafránková, J.; Pavlů, J.

2012-01-01

Electrons impinging on a target can release secondary electrons and/or they can be scattered out of the target. It is well established that the number of escaping electrons per primary electron depends on the target composition and dimensions, the energy, and incidence angle of the primary electrons, but there are suggestions that the target's shape and surface roughness also influence the secondary emission. We present a further modification of the model of secondary electron emission from dust grains which is applied to non-spherical grains and grains with defined surface roughness. It is shown that the non-spherical grains give rise to a larger secondary electron yield, whereas the surface roughness leads to a decrease in the yield. Moreover, these effects can be distinguished: the shape effect is prominent for high primary energies, whereas the surface roughness predominantly affects the yield at the low-energy range. The calculations use the Lunar Highlands Type NU-LHT-2M simulant as a grain material and the results are compared with previously published laboratory and in situ measurements.

Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probes

Energy Technology Data Exchange (ETDEWEB)

Han, Myung-Geun, E-mail: mghan@bnl.gov [Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973 (United States); Garlow, Joseph A. [Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973 (United States); Materials Science and Engineering Department, Stony Brook University, Stony Brook, NY 11794 (United States); Marshall, Matthew S.J.; Tiano, Amanda L. [Department of Chemistry, Stony Brook University, Stony Brook, NY 11974 (United States); Wong, Stanislaus S. [Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973 (United States); Department of Chemistry, Stony Brook University, Stony Brook, NY 11974 (United States); Cheong, Sang-Wook [Department of Physics and Astronomy, Rutgers Center for Emergent Materials, Rutgers University, Piscataway, NJ 08854 (United States); Walker, Frederick J.; Ahn, Charles H. [Department of Applied Physics and Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520 (United States); Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520 (United States); Zhu, Yimei [Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973 (United States)

2017-05-15

Highlights: • Electron-beam-induced-current (EBIC) and active secondary-electron voltage-contrast (SE-VC) are demonstrated in STEM mode combined with in situ electrical biasing in a TEM. • Electrostatic potential maps in ferroelectric thin films, multiferroic nanowires, and single crystals obtained by off-axis electron holography were compared with EBIC and SE-VC data. • Simultaneous EBIC and active SE-VC performed with atomic resolution STEM are demonstrated. - Abstract: The ability to map out electrostatic potentials in materials is critical for the development and the design of nanoscale electronic and spintronic devices in modern industry. Electron holography has been an important tool for revealing electric and magnetic field distributions in microelectronics and magnetic-based memory devices, however, its utility is hindered by several practical constraints, such as charging artifacts and limitations in sensitivity and in field of view. In this article, we report electron-beam-induced-current (EBIC) and secondary-electron voltage-contrast (SE-VC) with an aberration-corrected electron probe in a transmission electron microscope (TEM), as complementary techniques to electron holography, to measure electric fields and surface potentials, respectively. These two techniques were applied to ferroelectric thin films, multiferroic nanowires, and single crystals. Electrostatic potential maps obtained by off-axis electron holography were compared with EBIC and SE-VC to show that these techniques can be used as a complementary approach to validate quantitative results obtained from electron holography analysis.

Simulation of secondary emission calorimeter for future colliders

Science.gov (United States)

Yetkin, E. A.; Yetkin, T.; Ozok, F.; Iren, E.; Erduran, M. N.

2018-03-01

We present updated results from a simulation study of a conceptual sampling electromagnetic calorimeter based on secondary electron emission process. We implemented the secondary electron emission process in Geant4 as a user physics list and produced the energy spectrum and yield of secondary electrons. The energy resolution of the SEE calorimeter was σ/E = (41%) GeV1/2/√E and the response linearity to electromagnetic showers was to within 1.5%. The simulation results were also compared with a traditional scintillator calorimeter.

Secondary electron images obtained with a standard photoelectron emission microscope set-up

International Nuclear Information System (INIS)

Benka, Oswald; Zeppenfeld, Peter

2005-01-01

The first results of secondary electron images excited by 3-4.3 keV electrons are presented. The images are obtained with a standard FOCUS-PEEM set-up equipped with an imaging energy filter (IEF). The electron gun was mounted on a standard PEEM entrance flange at an angle of 25 deg. with respect to the sample surface. A low extraction voltage of 500 V was used to minimize the deflection of the electron beam by the PEEM extraction electrode. The secondary electron images are compared to photoelectron images excited by a standard 4.9 eV UV lamp. In the case of a Cu pattern on a Si substrate it is found that the lateral resolution without the IEF is about the same for electron and photon excitation but that the relative electron emission intensities are very different. The use of the IEF reduces the lateral resolution. Images for secondary electron energies between eV 1 and eV 2 were obtained by setting the IEF to -V 1 and -V 2 ∼-(V 1 +5V) potentials and taking the difference of both images. Images up to 100 eV electron energies were recorded. The material contrast obtained in these difference images is discussed in terms of a secondary electron and photoelectron emission model and secondary electron energy spectra measured with a LEED-Auger spectrometer

Ionization yield from electron tracks in liquid xenon

International Nuclear Information System (INIS)

Voronova, T.Ya.; Kipsanov, M.A.; Kruglov, A.A.; Obodovskij, I.M.; Pokachalov, S.G.; Shilov, V.A.; Khristich, E.B.

1989-01-01

Methods for calculating coefficients K β , characterizing ionization yield from electron track in liquid xenon are considered. K β calculation is conducted on the base of experimental data on K parameter characterizing ionization yield from a certain combination of photo-, Compton-and Auger electron tracks. K parameter measurements are conducted in liquid xenon at 170 K temperature within 10-30 keV gamma- and X radiation energy ranges. Calculated dependence of K β and K coefficients on the energy in a wide (5-500 keV) range is presented. K β values obtained can be applied for calculating the energy resolution of a gamma-spectrometer and linearity of its calibration characteristics if the electric field intensity in the spectrometer does not exceed some kV/cm

Evaluation of secondary electron filter for removing contaminant electrons from high-energy 6 MV x-ray beam

International Nuclear Information System (INIS)

Kumagai, Kozo

1988-01-01

When using high energy X-rays, the dose increases at the skin surface and build-up region of beam contamination of secondary electrons coming out from the inner surface of the lineac head. At our radiotherapy department, many cases of external otitis from severe skin reactions, particularly resulting from whole brain irradiation of primary and metastatic brain tumors with a 6 MV X-ray lineac, have been encountered. An investigation was made of the physical aspects of a 6 MV X-ray beam using three electron filters, lead lucite, lead glass and lucite to remove secondary electrons. Transparent materials for filters should be preferable for locating the light field. The following results were obtained: 1) For removing secondary electrons, a lead lucite filter was found best. 2) The lead lucite filter proved most effective for removing secondary electrons from the area of treatment. It reduced the dose of irradiation to the skin surface and build-up region, and furthermore improved the depth dose relative to that without filters. 3) From a clinical standpoint, skin reactions such as external otitis remarkably decreased using a lead lucite filter. 4) It thus appears necessary to use a high energy X-ray with newly designed filters to reduce beam contamination of secondary electrons. (author)

Isoprene oxidation by nitrate radical: alkyl nitrate and secondary organic aerosol yields

Directory of Open Access Journals (Sweden)

A. W. Rollins

2009-09-01

Full Text Available Alkyl nitrates and secondary organic aerosol (SOA produced during the oxidation of isoprene by nitrate radicals has been observed in the SAPHIR (Simulation of Atmospheric PHotochemistry In a large Reaction Chamber chamber. A 16 h dark experiment was conducted with temperatures at 289–301 K, and maximum concentrations of 11 ppb isoprene, 62.4 ppb O₃ and 31.1 ppb NO_x. We find the yield of nitrates is 70±8% from the isoprene + NO₃ reaction, and the yield for secondary dinitrates produced in the reaction of primary isoprene nitrates with NO₃ is 40±20%. We find an effective rate constant for reaction of NO₃ with the group of first generation oxidation products to be 7×10⁻¹⁴ molecule⁻¹ cm³ s⁻¹. At the low total organic aerosol concentration in the chamber (max=0.52 μg m⁻³ we observed a mass yield (ΔSOA mass/Δisoprene mass of 2% for the entire 16 h experiment. However a comparison of the timing of the observed SOA production to a box model simulation of first and second generation oxidation products shows that the yield from the first generation products was <0.7% while the further oxidation of the initial products leads to a yield of 14% (defined as ΔSOA/Δisoprene^2x where Δisoprene^2x is the mass of isoprene which reacted twice with NO₃. The SOA yield of 14% is consistent with equilibrium partitioning of highly functionalized C₅ products of isoprene oxidation.

Primary and Secondary Yield Losses Caused by Pests and Diseases: Assessment and Modeling in Coffee.

Science.gov (United States)

Cerda, Rolando; Avelino, Jacques; Gary, Christian; Tixier, Philippe; Lechevallier, Esther; Allinne, Clémentine

2017-01-01

The assessment of crop yield losses is needed for the improvement of production systems that contribute to the incomes of rural families and food security worldwide. However, efforts to quantify yield losses and identify their causes are still limited, especially for perennial crops. Our objectives were to quantify primary yield losses (incurred in the current year of production) and secondary yield losses (resulting from negative impacts of the previous year) of coffee due to pests and diseases, and to identify the most important predictors of coffee yields and yield losses. We established an experimental coffee parcel with full-sun exposure that consisted of six treatments, which were defined as different sequences of pesticide applications. The trial lasted three years (2013-2015) and yield components, dead productive branches, and foliar pests and diseases were assessed as predictors of yield. First, we calculated yield losses by comparing actual yields of specific treatments with the estimated attainable yield obtained in plots which always had chemical protection. Second, we used structural equation modeling to identify the most important predictors. Results showed that pests and diseases led to high primary yield losses (26%) and even higher secondary yield losses (38%). We identified the fruiting nodes and the dead productive branches as the most important and useful predictors of yields and yield losses. These predictors could be added in existing mechanistic models of coffee, or can be used to develop new linear mixed models to estimate yield losses. Estimated yield losses can then be related to production factors to identify corrective actions that farmers can implement to reduce losses. The experimental and modeling approaches of this study could also be applied in other perennial crops to assess yield losses.

Plant growth analysis used as secondary traits in selection for high yield on groundnut

International Nuclear Information System (INIS)

Manshuri, A.G.; Nugrahaeni

1996-01-01

Groundnut growth and yield can be expressed as the product to solar radiation interception (Qi), conversion efficiency of radiation to total dry matter (Ek) and partitioning efficiency to economic yield (Ep) or harvest index. Groundnut genotypes differ in characters related to Qi, Ek and Ep, and the characters have the possibility to be used as secondary traits in selection for high yield. Extinction coefficient (k) and leaf area index (LAI) are the influential factors in increasing Qi. Variability in leaf size lead to the description of the existence of variability in k value within the genotypes under study. LAI three is the level necessary to attain 90 percent total radiation absorption in groundnut. An increased of LAI exceeding four would be inefficient for increasing the fraction of radiation absorption. Convertion efficiency of radiation to total dry matter (Ek) related to the rate of plant photosynthesis and respiration, inspite of the need study the field, however, the study was still limited. Harvest index can be used as a secondary trait to identify high yield genotypes. There was a positive correlation between pod yield and harvest index. An increased of harvest index by 1 percent caused an increased of dry pod as high as 0.365 g/plant. ICG 1697, ICGV 86844 and ICGV 87161 gave yield more than 3.5 t/ha, and their total dry matter (TDM) were 49.2, 52.5 and 40.7 g/plant, whereas their harvest indexes (HI) were 0.47, 0.46 and 0.55, respectively. Theoretically, improvement of the groundnut pod yield can be attained by using variety which has TDM 52.5 g/plant and HI 0.55. Using HI as secondary selection criteria, five genotypes were selected, i.e., G/C/LM-88-B-25 (HI 0.59), local Irian and local Lombok (HI 0.57), ICGV 87161 and LM/ICGV 87165-B-2-1 (HI 0.55). Two genotypes were selected for their high TDM, namely ICGV 86844 and LM/ICGV 87165-88-B-82 [in

Study of the Effects of the Electric Field on Charging Measurements on Individual Micron-size Dust Grains by Secondary Electron Emissions

Science.gov (United States)

Tankosic, D.; Abbas, M. M.

2013-01-01

The dust charging by electron impact is an important dust charging process in Astrophysical, Planetary, and the Lunar environments. Low energy electrons are reflected or stick to the grains charging the dust grains negatively. At sufficiently high energies electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Available theoretical models for the calculation of SEE yield applicable for neutral, planar or bulk surfaces are generally based on Sternglass Equation. However, viable models for charging of individual dust grains do not exist at the present time. Therefore, the SEE yields have to be obtained by some experimental methods at the present time. We have conducted experimental studies on charging of individual micron size dust grains in simulated space environments using an electrodynamic balance (EDB) facility at NASA-MSFC. The results of our extensive laboratory study of charging of individual micron-size dust grains by low energy electron impact indicate that the SEE by electron impact is a very complex process expected to be substantially different from the bulk materials. It was found that the incident electrons may lead to positive or negative charging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration. In this paper we give a more elaborate discussion about the possible effects of the AC field in the EDB on dust charging measurements by comparing the secondary electron emission time-period (tau (sub em) (s/e)) with the time-period (tau (sub ac) (ms)) of the AC field cycle in the EDB that we have briefly addressed in our previous publication.

Effect of secondary electron emission on the Jeans instability in a dusty plasma

International Nuclear Information System (INIS)

Sarkar, Susmita; Roy, Banamali; Maity, Saumyen; Khan, Manoranjan; Gupta, M. R.

2007-01-01

In this paper the effect of secondary electron emission on Jeans instability in a dusty plasma has been investigated. Due to secondary electron emission, dust grains may have two stable equilibrium states out of which one is negative and the other is positive. Here both cases have been considered separately. It has been shown that secondary electron emission enhances Jeans instability when equilibrium dust charge is negative. It has also been shown that growth rate of Jeans instability reduces with increasing secondary electron emission when equilibrium dust charge is positive

Detection of secondary electrons with pixelated hybrid semiconductor detectors

International Nuclear Information System (INIS)

Gebert, Ulrike Sonja

2011-01-01

Within the scope of this thesis, secondary electrons were detected with a pixelated semiconductor detector named Timepix. The Timepix detector consists of electronics and a sensor made from a semiconductor material. The connection of sensor and electronics is done for each pixel individually using bump bonds. Electrons with energies above 3 keV can be detected with the sensor. One electron produces a certain amount of electron-hole pairs according to its energy. The charge then drifts along an electric field to the pixel electronics, where it induces an electric signal. Even without a sensor it is possible to detect an electric signal from approximately 1000 electrons directly in the pixel electronics. Two different detector systems to detect secondary electrons using the Timepix detector were investigated during this thesis. First of all, a hybrid photon detector (HPD) was used to detect single photoelectrons. The HPD consists of a vacuum vessel with an entrance window and a cesium iodine photocathode at the inner surface of the window. Photoelectrons are released from the photocathode by incident light and are accelerated in an electric field towards the Timepix detector, where the point of interaction and the arrival time of the electron is determined. With a proximity focusing setup, a time resolution of 12 ns (with an acceleration voltage of 20 kV between photocathode and Timepix detector) was obtained. The HPD examined in this thesis showed a strong dependence of the dark rate form the acceleration voltage and the pressure in the vacuum vessel. At a pressure of few 10 -5 mbar and an acceleration voltage of 20 kV, the dark rate was about 800 Hz per mm 2 area of the read out photocathode. One possibility to reduce the dark rate is to identify ion feedback events. With a slightly modified setup it was possible to reduce the dark rate to 0.5 Hz/mm 2 . To achieve this, a new photocathode was mounted in a shorter distance to the detector. The measurements where

Secondary emission of negative ions and electrons resulting from electronic sputtering of cesium salts

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.

1993-04-01

Secondary ion emission of negative ions and electrons from alkali salts bombarded with high energy (9 MeV) Ar +++ is discussed. Quite different features are observed according to the nature of the salt investigated (halide or oxygenated). In the case of cesium, the electron emission from halides is characterized by intense electron showers (several hundred electrons) with narrow distributions in intensity and orientation. Conversely, for oxygenated salts, these distributions are broader, much less intense (one order of magnitude), and the ion emission exhibits an dissymmetry, which has never been observed for inorganics. This last result is interpreted in terms of radiolysis of the oxygenated salt, a process well documented for gamma-ray irradiation, but not yet reported in secondary ion emission. (author) 17 refs.; 10 figs

Secondary signal imaging (SSI) electron tomography (SSI-ET): A new three-dimensional metrology for mesoscale specimens in transmission electron microscope.

Science.gov (United States)

Han, Chang Wan; Ortalan, Volkan

2015-09-01

We have demonstrated a new electron tomography technique utilizing the secondary signals (secondary electrons and backscattered electrons) for ultra thick (a few μm) specimens. The Monte Carlo electron scattering simulations reveal that the amount of backscattered electrons generated by 200 and 300keV incident electrons is a monotonic function of the sample thickness and this causes the thickness contrast satisfying the projection requirement for the tomographic reconstruction. Additional contribution of the secondary electrons emitted from the edges of the specimens enhances the visibility of the surface features. The acquired SSI tilt series of the specimen having mesoscopic dimensions are successfully reconstructed verifying that this new technique, so called the secondary signal imaging electron tomography (SSI-ET), can directly be utilized for 3D structural analysis of mesoscale structures. Published by Elsevier Ltd.

Comparison of the target-thickness dependence of the convoy electron yield and the Rydberg electron yield measured in coincidence with exit charge states in fast ion-solid collisions

International Nuclear Information System (INIS)

Gaither, C.C. III; Breinig, M.; Freyou, J.; Underwood, T.A.

1988-01-01

We have simultaneously measured the yield of convoy electrons and the yield of electrons in high Rydberg states of the projectile (n /approx gt/ 70), produced by 2MeV/u C projectiles passing through C foils, whose thicknesses range from 4--10 ug/cm 2 , for incident charge states q/sub i/ = 4--6 and exit charge states q/sub e/ = 4--6. We have found that these yields exhibit similar trends as a function of foil thickness, but that, nevertheless, the ratio of the number of convoy electrons detected in coincidence with ions of exit charge state q/sub e/ to the number of electrons detected in high Rydberg states of ions with the same exit charge state is a function of foil thickness. This may be due to a broadening of the convoy electron energy spectrum with increasing foil thickness. 6 refs., 3 figs

Effect of Secondary Electron Emission on Electron Cross-Field Current in E×B Discharges

Energy Technology Data Exchange (ETDEWEB)

Yevgeny Raitses, Igor D. Kaganovich, Alexander Khrabrov, Dmytro Sydorenko, Nathaniel J. Fisch and Andrei Smolyakov

2011-02-10

This paper reviews and discusses recent experimental, theoretical, and numerical studies of plasma-wall interaction in a weakly collisional magnetized plasma bounded with channel walls made from different materials. A lowpressure ExB plasma discharge of the Hall thruster was used to characterize the electron current across the magnetic field and its dependence on the applied voltage and electron-induced secondary electron emission (SEE) from the channel wall. The presence of a depleted, anisotropic electron energy distribution function with beams of secondary electrons was predicted to explain the enhancement of the electron cross-field current observed in experiments. Without the SEE, the electron crossfield transport can be reduced from anomalously high to nearly classical collisional level. The suppression of SEE was achieved using an engineered carbon velvet material for the channel walls. Both theoretically and experimentally, it is shown that the electron emission from the walls can limit the maximum achievable electric field in the magnetized plasma. With nonemitting walls, the maximum electric field in the thruster can approach a fundamental limit for a quasineutral plasma.

Transient effects in SIMS analysis of Si with Cs sup + at high incidence angles Secondary ion yield variations

CERN Document Server

Heide, P A W

2002-01-01

Secondary ion mass spectrometry (SIMS) depth profile analysis of Si wafers using 1 keV Cs sup + primary ions at large incidence angles (80 deg. ) is plagued by unusually strong transient effects (variations in both sputter and ion yields). Analysis of a native oxide terminated Si wafer with and without the aid of an O sub 2 leak, and an Ar sup + pre-sputtered wafer revealed correlations between the implanted Cs content and various secondary ion intensities consistent with that expected from a resonance charge transfer process (that assumed by the electron tunneling model). Cs concentrations were defined through X-ray photoelectron spectroscopy of the sputtered surface from SIMS profiles terminated within the transient region. These scaled with the surface roughening occurring under these conditions and can be explained as resulting from the associated drop in sputter rates. An O induced transient effect from the native oxide was also identified. Characterization of these effects allowed the reconstruction of ...

Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment

International Nuclear Information System (INIS)

Stevie, F.A.; Kahora, P.M.; Simons, D.S.; Chi, P.

1988-01-01

Changes in secondary ion yields of matrix and dopant species have been correlated with changes in surface topography during O + 2 bombardment of Si and GaAs. In Si, profiles were measured in (100) wafers at 6- and 8-keV impact energy. At 6 keV, a yield increase of about 70% occurred for Si + over a depth range of 2.5 to 3.5 μm, with changes in other species ranging from a decrease of ∼20% for Si + 3 to an increase of more than 25% for O + . The development of a rippled surface topography was observed in scanning electron micrographs over the same depth range. Similar effects occurred over a 3--5 μm depth range for 8-keV ions, and in (111) silicon at a depth of 3 to 4 μm for 6-keV ions. No differences were noted between p- and n-type silicon, or implanted and unimplanted silicon. In GaAs, profiles were measured in (100) wafers at 2.5-, 5.5-, and 8-keV impact energies. At 8 keV, a yield increase of about 70% was found for GaO + in the range 0.6--1.0 μm, with smaller changes for other matrix species. At 5.5 keV, similar effects were observed, but over a depth interval of 0.3 to 0.7 μm. No yield changes were detected at 2.5-keV impact energy. The yield changes at the higher energies were again correlated with the onset of changes in topography. No change in ion yield or surface topography was noted for Cs + bombardment of Si or GaAs. The topography and ion yield changes are affected by the angle of incidence and, for Si, the oxygen coverage. The results show that the practice of normalizing secondary ion mass spectrometry dopant profiles to a matrix signal must be modified for situations where matrix yield changes occur

Subnanosecond breakdown development in high-voltage pulse discharge: Effect of secondary electron emission

Science.gov (United States)

Alexandrov, A. L.; Schweigert, I. V.; Zakrevskiy, Dm. E.; Bokhan, P. A.; Gugin, P.; Lavrukhin, M.

2017-10-01

A subnanosecond breakdown in high-voltage pulse discharge may be a key tool for superfast commutation of high power devices. The breakdown in high-voltage open discharge at mid-high pressure in helium was studied in experiment and in kinetic simulations. The kinetic model of electron avalanche development was constructed, based on PIC-MCC simulations, including dynamics of electrons, ions and fast helium atoms, produced by ions scattering. Special attention was paid to electron emission processes from cathode, such as: photoemission by Doppler-shifted resonant photons, produced in excitation processes involving fast atoms; electron emission by ions and fast atoms bombardment of cathode; the secondary electron emission (SEE) by hot electrons from bulk plasma. The simulations show that the fast atoms accumulation is the main reason of emission growth at the early stage of breakdown, but at the final stage, when the voltage on plasma gap diminishes, namely the SEE is responsible for subnanosecond rate of current growth. It was shown that the characteristic time of the current growth can be controlled by the SEE yield. The influence of SEE yield for three types of cathode material (titanium, SiC, and CuAlMg-alloy) was tested. By changing the pulse voltage amplitude and gas pressure, the area of existence of subnanosecond breakdown is identified. It is shown that in discharge with SiC and CuAlMg-alloy cathodes (which have enhanced SEE) the current can increase with a subnanosecond characteristic time value as small as τs = 0.4 ns, for the pulse voltage amplitude of 5÷12 kV. An increase of gas pressure from 15 Torr to 30 Torr essentially decreases the time of of current front growth, whereas the pulse voltage variation weakly affects the results.

Magnetic insulation of secondary electrons in plasma source ion implantation

International Nuclear Information System (INIS)

Rej, D.J.; Wood, B.P.; Faehl, R.J.; Fleischmann, H.H.

1993-01-01

The uncontrolled loss of accelerated secondary electrons in plasma source ion implantation (PSII) can significantly reduce system efficiency and poses a potential x-ray hazard. This loss might be reduced by a magnetic field applied near the workpiece. The concept of magnetically-insulated PSII is proposed, in which secondary electrons are trapped to form a virtual cathode layer near the workpiece surface where the local electric field is essentially eliminated. Subsequent electrons that are emitted can then be reabsorbed by the workpiece. Estimates of anomalous electron transport from microinstabilities are made. Insight into the process is gained with multi-dimensional particle-in-cell simulations

Substrate dependence of electron-stimulated O - yields from dissociative electron attachment to physisorbed O2

Science.gov (United States)

Huels, M. A.; Parenteau, L.; Sanche, L.

1994-03-01

We present measurements of O- electron stimulated desorption yields obtained under identical experimental conditions from 0.15 monolayers (ML) of O2 deposited onto disordered substrates consisting of 4 ML of either Kr, Xe, C2H6, C2H4, N2O, CH3Cl, or H2O, all condensed on Pt (polycrystalline). The resulting O- yield functions, for incident electron energies below 20 eV, are compared to that obtained from the O2/Kr solid; this allows us to assess the order of magnitude effects of the local substrate environment on dissociative electron attachment (DEA) via the 2Πu and gas phase forbidden 2Σ+g,u resonances of O-2. We note that, in addition to electron energy losses in the substrate prior to DEA to O2 and post-dissociation interactions of the O- with the substrate molecules, charge or energy transfer from the O-2 transient anion to a substrate molecule, and capture of the incident electron into a dissociative anion resonance of the substrate molecule may contribute to a reduced O- yield from the physisorbed O2. In the case of O2 deposited on amorphous ice, we find that the O- signal from DEA to O2 is completely absent for electron energies below 14 eV; we attribute this to a complete quenching of the dissociative O-2(2Πu, 2Σ+) resonances by the adjacent water molecules.

Secondary electron spectroscopy and Auger microscopy at high spatial resolution. Application to scanning electron microscopy

International Nuclear Information System (INIS)

Le Gressus, Claude; Massignon, Daniel; Sopizet, Rene

1979-01-01

Secondary electron spectroscopy (SES), Auger electron spectroscopy (AES) and electron energy loss spectroscopy (ELS) are combined with ultra high vacuum scanning microscopy (SEM) for surface analysis at high spatial resolution. Reliability tests for the optical column for the vacuum and for the spectrometer are discussed. Furthermore the sensitivity threshold in AES which is compatible with a non destructive surface analysis at high spatial resolution is evaluated. This combination of all spectroscopies is used in the study of the beam damage correlated with the well known secondary electron image (SEI) darkening still observed in ultra high vacuum. The darkening is explained as a bulk decontamination of the sample rather than as a surface contamination from the residual vacuum gas [fr

Secondary electron emission characteristics of oxide electrodes in flat electron emission lamp

Directory of Open Access Journals (Sweden)

Chang-Lin Chiang

2016-01-01

Full Text Available The present study concerns with the secondary electron emission coefficient, γ, of the cathode materials used in the newly developed flat electron emission lamp (FEEL devices, which essentially integrates the concept of using cathode for fluorescent lamp and anode for cathode ray tube (CRT to obtain uniform planar lighting. Three different cathode materials, namely fluorine-doped tin oxide (FTO, aluminum oxide coated FTO (Al2O3/FTO and magnesium oxide coated FTO (MgO/FTO were prepared to investigate how the variations of γ and working gases influence the performance of FEEL devices, especially in lowering the breakdown voltage and pressure of the working gases. The results indicate that the MgO/FTO bilayer cathode exhibited a relatively larger effective secondary electron emission coefficient, resulting in significant reduction of breakdown voltage to about 3kV and allowing the device to be operated at the lower pressure to generate the higher lighting efficiency.

Secondary electron emission characteristics of oxide electrodes in flat electron emission lamp

Energy Technology Data Exchange (ETDEWEB)

Chiang, Chang-Lin, E-mail: CLChiang@itri.org.tw; Li, Chia-Hung [Green Energy and Environment Research Laboratories, Industrial Technology Research Institute, 195, Sec. 4, Chung Hsing Road, Chutung 310, Taiwan (China); Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan (China); Zeng, Hui-Kai [Department of Electronic Engineering, Chung Yuan Christian University, 200 Chung Pei Road, Chung Li 320, Taiwan (China); Li, Jung-Yu, E-mail: JY-Lee@itri.org.tw; Chen, Shih-Pu; Lin, Yi-Ping [Green Energy and Environment Research Laboratories, Industrial Technology Research Institute, 195, Sec. 4, Chung Hsing Road, Chutung 310, Taiwan (China); Hsieh, Tai-Chiung; Juang, Jenh-Yih, E-mail: jyjuang@cc.nctu.edu.tw [Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan (China)

2016-01-15

The present study concerns with the secondary electron emission coefficient, γ, of the cathode materials used in the newly developed flat electron emission lamp (FEEL) devices, which essentially integrates the concept of using cathode for fluorescent lamp and anode for cathode ray tube (CRT) to obtain uniform planar lighting. Three different cathode materials, namely fluorine-doped tin oxide (FTO), aluminum oxide coated FTO (Al{sub 2}O{sub 3}/FTO) and magnesium oxide coated FTO (MgO/FTO) were prepared to investigate how the variations of γ and working gases influence the performance of FEEL devices, especially in lowering the breakdown voltage and pressure of the working gases. The results indicate that the MgO/FTO bilayer cathode exhibited a relatively larger effective secondary electron emission coefficient, resulting in significant reduction of breakdown voltage to about 3kV and allowing the device to be operated at the lower pressure to generate the higher lighting efficiency.

Characteristics of a cold cathode electron source combined with secondary electron emission in a FED

International Nuclear Information System (INIS)

Lei Wei; Zhang Xiaobing; Zhou Xuedong; Zhu Zuoya; Lou Chaogang; Zhao Hongping

2005-01-01

In electron beam devices, the voltage applied to the cathode (w.r.t. grid voltage) provides the initial energy for the electrons. Based on the type of electron emission, the electron sources are (mainly) classified into thermionic cathodes and cold cathodes. The power consumption of a cold cathode is smaller than that of a thermionic cathode. The delay time of the electron emission from a cold cathode following the voltage rise is also smaller. In cathode ray tubes, field emission display (=FED) panels and other devices, the electron current emitted from the cathode needs to be modulated. Since the strong electric field, which is required to extract electrons from the cold cathode, accelerates the electrons to a high velocity near the gate electrode, the required voltage swing for the current modulation is also high. The design of the driving circuit becomes quite difficult and expensive for a high driving voltage. In this paper, an insulator plate with holes is placed in front of a cold cathode. When the primary electrons hit the surface of the insulator tunnels, secondary electrons are generated. In this paper, the characteristics of the secondary electrons emitted from the gate structure are studied. Because the energies of the secondary electrons are smaller than that of the primary electron, the driving voltage for the current modulation is decreased by the introduction of the insulator tunnels, resulting in an improved energy uniformity of the electron beam. Triode structures with inclined insulator tunnels and with double insulator plates are also fabricated and lead to further improvements in the energy uniformity. The improved energy uniformity predicted by the simulation calculations is demonstrated by the improved brightness uniformity in the screen display images

Development of a secondary electron energy analyzer for a transmission electron microscope.

Science.gov (United States)

Magara, Hideyuki; Tomita, Takeshi; Kondo, Yukihito; Sato, Takafumi; Akase, Zentaro; Shindo, Daisuke

2018-04-01

A secondary electron (SE) energy analyzer was developed for a transmission electron microscope. The analyzer comprises a microchannel plate (MCP) for detecting electrons, a coil for collecting SEs emitted from the specimen, a tube for reducing the number of backscattered electrons incident on the MCP, and a retarding mesh for selecting the energy of SEs incident on the MCP. The detection of the SEs associated with charging phenomena around a charged specimen was attempted by performing electron holography and SE spectroscopy using the energy analyzer. The results suggest that it is possible to obtain the energy spectra of SEs using the analyzer and the charging states of a specimen by electron holography simultaneously.

Secondary Electron Emission from Solid Hydrogen and Deuterium Resulting from Incidence of keV Electrons and Hydrogen Ions

DEFF Research Database (Denmark)

Sørensen, H.

1977-01-01

are small, in contrast to what is expected for insulating materials. One explanation is that the secondary electrons lose energy inside the target material by exciting vibrational and rotational states of the molecules, so that the number of electrons that may escape as secondary electrons is rather small....... The losses to molecular states will be largest for hydrogen, so that the SEE coefficients are smallest for solid hydrogen, as was observed. For the incidence of ions, the values of δ for the different molecular ions agree when the number of secondary electrons per incident atom is plotted versus the velocity...... or the stopping power of the incident particles. Measurements were also made for oblique incidence of H+ ions on solid deuterium for angles of incidence up to 75°. A correction could be made for the emission of secondary ions by also measuring the current calorimetrically. At largest energies, the angular...

Effect of Secondary Electron Emission on Electron Cross-Field Current in E x B Discharges

International Nuclear Information System (INIS)

Raitses, Yevgeny; Kaganovich, Igor D.; Khrabrov, Alexander; Sydorenko, Dmytro; Fisch, Nathaniel J.; Smolyakov, Andrei

2011-01-01

This paper reviews and discusses recent experimental, theoretical, and numerical studies of plasma-wall interaction in a weakly collisional magnetized plasma bounded with channel walls made from different materials. A lowpressure ExB plasma discharge of the Hall thruster was used to characterize the electron current across the magnetic field and its dependence on the applied voltage and electron-induced secondary electron emission (SEE) from the channel wall. The presence of a depleted, anisotropic electron energy distribution function with beams of secondary electrons was predicted to explain the enhancement of the electron cross-field current observed in experiments. Without the SEE, the electron crossfield transport can be reduced from anomalously high to nearly classical collisional level. The suppression of SEE was achieved using an engineered carbon velvet material for the channel walls. Both theoretically and experimentally, it is shown that the electron emission from the walls can limit the maximum achievable electric field in the magnetized plasma. With nonemitting walls, the maximum electric field in the thruster can approach a fundamental limit for a quasineutral plasma.

Secondary electron emission from plasma processed accelerating cavity grade niobium

Science.gov (United States)

Basovic, Milos

Advances in the particle accelerator technology have enabled numerous fundamental discoveries in 20th century physics. Extensive interdisciplinary research has always supported further development of accelerator technology in efforts of reaching each new energy frontier. Accelerating cavities, which are used to transfer energy to accelerated charged particles, have been one of the main focuses of research and development in the particle accelerator field. Over the last fifty years, in the race to break energy barriers, there has been constant improvement of the maximum stable accelerating field achieved in accelerating cavities. Every increase in the maximum attainable accelerating fields allowed for higher energy upgrades of existing accelerators and more compact designs of new accelerators. Each new and improved technology was faced with ever emerging limiting factors. With the standard high accelerating gradients of more than 25 MV/m, free electrons inside the cavities get accelerated by the field, gaining enough energy to produce more electrons in their interactions with the walls of the cavity. The electron production is exponential and the electron energy transfer to the walls of a cavity can trigger detrimental processes, limiting the performance of the cavity. The root cause of the free electron number gain is a phenomenon called Secondary Electron Emission (SEE). Even though the phenomenon has been known and studied over a century, there are still no effective means of controlling it. The ratio between the electrons emitted from the surface and the impacting electrons is defined as the Secondary Electron Yield (SEY). A SEY ratio larger than 1 designates an increase in the total number of electrons. In the design of accelerator cavities, the goal is to reduce the SEY to be as low as possible using any form of surface manipulation. In this dissertation, an experimental setup was developed and used to study the SEY of various sample surfaces that were treated

Secondary Electron Emission from Plasma Processed Accelerating Cavity Grade Niobium

Energy Technology Data Exchange (ETDEWEB)

Basovic, Milos [Old Dominion Univ., Norfolk, VA (United States)

2016-05-01

Advances in the particle accelerator technology have enabled numerous fundamental discoveries in 20th century physics. Extensive interdisciplinary research has always supported further development of accelerator technology in efforts of reaching each new energy frontier. Accelerating cavities, which are used to transfer energy to accelerated charged particles, have been one of the main focuses of research and development in the particle accelerator field. Over the last fifty years, in the race to break energy barriers, there has been constant improvement of the maximum stable accelerating field achieved in accelerating cavities. Every increase in the maximum attainable accelerating fields allowed for higher energy upgrades of existing accelerators and more compact designs of new accelerators. Each new and improved technology was faced with ever emerging limiting factors. With the standard high accelerating gradients of more than 25 MV/m, free electrons inside the cavities get accelerated by the field, gaining enough energy to produce more electrons in their interactions with the walls of the cavity. The electron production is exponential and the electron energy transfer to the walls of a cavity can trigger detrimental processes, limiting the performance of the cavity. The root cause of the free electron number gain is a phenomenon called Secondary Electron Emission (SEE). Even though the phenomenon has been known and studied over a century, there are still no effective means of controlling it. The ratio between the electrons emitted from the surface and the impacting electrons is defined as the Secondary Electron Yield (SEY). A SEY ratio larger than 1 designates an increase in the total number of electrons. In the design of accelerator cavities, the goal is to reduce the SEY to be as low as possible using any form of surface manipulation. In this dissertation, an experimental setup was developed and used to study the SEY of various sample surfaces that were treated

Multiplicity of secondary electrons emitted by carbon thin targets by impact of H0, H2+ and H3+ projectiles at MeV energies

International Nuclear Information System (INIS)

Vidovic, Zvonimir

1997-01-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25 - 2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. Phenomenological and theoretical descriptions as well as a summary of the main theoretical models are the subjects of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of the thin carbon foils crossed by an energetic projectile is described in the chapter two. In this chapter there are also presented the method and the algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H 0 atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of the ions with solids. The role of the proximity of the protons, molecular ions fragments, upon the amplitude of these collected effects is evidenced from the study of the statistics of forward emission. The experiments allowed us to shed light on various aspects of atom and polyatomic ion interactions with solid surfaces. (author)

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range

International Nuclear Information System (INIS)

Vidovic, Z.

1997-06-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Secondary-electron-emission losses in multistage depressed collectors and traveling-wave-tube efficiency improvements with carbon collector electrode surfaces

Science.gov (United States)

Ramins, P.; Ebihara, B. T.

1986-01-01

Secondary-electron-emission losses in multistage depressed collectors (MDC's) and their effects on overall traveling-wave-tube (TWT) efficiency were investigated. Two representative TWT's and several computer-modeled MDC's were used. The experimental techniques provide the measurement of both the TWT overall and the collector efficiencies. The TWT-MDC performance was optimized and measured over a wide range of operating conditions, with geometrically identical collectors, which utilized different electrode surface materials. Comparisons of the performance of copper electrodes to that of various forms of carbon, including pyrolytic and iisotropic graphites, were stressed. The results indicate that: (1) a significant improvement in the TWT overall efficiency was obtained in all cases by the use of carbon, rather than copper electrodes, and (2) that the extent of this efficiency enhancement depended on the characteristics of the TWT, the TWT operating point, the MDC design, and collector voltages. Ion textured graphite was found to be particularly effective in minimizing the secondary-electron-emission losses. Experimental and analytical results, however, indicate that it is at least as important to provide a maximum amount of electrostatic suppression of secondary electrons by proper MDC design. Such suppression, which is obtained by ensuring that a substantial suppressing electric field exists over the regions of the electrodes where most of the current is incident, was found to be very effective. Experimental results indicate that, with proper MDC design and the use of electrode surfaces with low secondary-electron yield, degradation of the collector efficiency can be limited to a few percent.

Experimental Investigation of Charging Properties of Interstellar Type Silica Dust Grains by Secondary Electron Emissions

Science.gov (United States)

Tankosic, D.; Abbas, M. M.

2013-01-01

The dust charging by electron impact is an important dust charging processes in astrophysical and planetary environments. Incident low energy electrons are reflected or stick to the grains charging the dust grains negatively. At sufficiently high energies electrons penetrate the grains, leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Available classical theoretical models for calculations of SEE yields are generally applicable for neutral, planar, or bulk surfaces. These models, however, are not valid for calculations of the electron impact charging properties of electrostatically charged micron/submicron-size dust grains in astrophysical environments. Rigorous quantum mechanical models are not yet available, and the SEE yields have to be determined experimentally for development of more accurate models for charging of individual dust grains. At the present time, very limited experimental data are available for charging of individual micron-size dust grains, particularly for low energy electron impact. The experimental results on individual, positively charged, micron-size lunar dust grains levitated carried out by us in a unique facility at NASA-MSFC, based on an electrodynamic balance, indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (Abbas et al, 2010, 2012). In this paper, we discuss SEE charging properties of individual micron-size silica microspheres that are believed to be analogs of a class of interstellar dust grains. The measurements indicate charging of the 0.2m silica particles when exposed to 25 eV electron beams and discharging when exposed to higher energy electron beams. Relatively large size silica particles (5.2-6.82m) generally discharge to lower equilibrium potentials at both electron energies

Sheath structure transition controlled by secondary electron emission

Science.gov (United States)

Schweigert, I. V.; Langendorf, S. J.; Walker, M. L. R.; Keidar, M.

2015-04-01

In particle-in-cell Monte Carlo collision (PIC MCC) simulations and in an experiment we study sheath formation over an emissive floating Al2O3 plate in a direct current discharge plasma at argon gas pressure 10-4 Torr. The discharge glow is maintained by the beam electrons emitted from a negatively biased hot cathode. We observe three types of sheaths near the floating emissive plate and the transition between them is driven by changing the negative bias. The Debye sheath appears at lower voltages, when secondary electron emission is negligible. With increasing applied voltage, secondary electron emission switches on and a first transition to a new sheath type, beam electron emission (BEE), takes place. For the first time we find this specific regime of sheath operation near the floating emissive surface. In this regime, the potential drop over the plate sheath is about four times larger than the temperature of plasma electrons. The virtual cathode appears near the emissive plate and its modification helps to maintain the BEE regime within some voltage range. Further increase of the applied voltage U initiates the second smooth transition to the plasma electron emission sheath regime and the ratio Δφs/Te tends to unity with increasing U. The oscillatory behavior of the emissive sheath is analyzed in PIC MCC simulations. A plasmoid of slow electrons is formed near the plate and transported to the bulk plasma periodically with a frequency of about 25 kHz.

Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions

Science.gov (United States)

Petrov, Yu. V.; Anikeva, A. E.; Vyvenko, O. F.

2018-06-01

Secondary electron emission from thin silicon nitride films of different thicknesses on silicon excited by helium ions with energies from 15 to 35 keV was investigated in the helium ion microscope. Secondary electron yield measured with Everhart-Thornley detector decreased with the irradiation time because of the charging of insulating films tending to zero or reaching a non-zero value for relatively thick or thin films, respectively. The finiteness of secondary electron yield value, which was found to be proportional to electronic energy losses of the helium ion in silicon substrate, can be explained by the electron emission excited from the substrate by the helium ions. The method of measurement of secondary electron energy distribution from insulators was suggested, and secondary electron energy distribution from silicon nitride was obtained.

Neutron yield of medical electron accelerators

International Nuclear Information System (INIS)

McCall, R.C.

1988-01-01

Shielding calculations for medical electron accelerators above about 10 MeV require some knowledge of the neutron emission from the machine. This knowledge might come from the manufacturer's specifications or from published measurements of the neutron leakage of that particular model and energy of accelerator. In principle, the yield can be calculated if details of the accelerator design are known. These details are often not available because the manufacturer considers them proprietary. A broader knowledge of neutron emission would be useful and it is the purpose of this paper to present such information

The calculation of proton and secondary electron stopping powers in liquid water

International Nuclear Information System (INIS)

Marouane, Abdelhak; Inchaouh, Jamal; Ouaskit, Said; Fathi, Ahmed

2012-01-01

The stopping power of energetic protons in liquid water has been calculated using a new model based on different theoretical and semi-empirical approaches. In this model, we consider the relativistic corrections along with the electronic and nuclear stopping power. The present work accounts for the different interactions made with electrons and nuclei inside the target. Interactions of the incident particle with the target's electrons dominate in the high energy regime; in the low energy regime, the interactions of the projectile with the target nuclei contribute importantly and are included in the calculation. We also compute the stopping cross sections and the stopping power of secondary electrons ejected from proton and hydrogen ionization impact, and generated by hydrogen electron loss processes. The consideration of secondary electrons' stopping power can contribute to the study of nano-dosimetry. Our results are in good agreement with existing experimental data. This calculation model can be useful for different applications in medical physics and space radiation health, such as hadron therapy for cancer treatment or radiation protection for astronauts. - Highlights: ► We discussed the stopping cross sections at the Bragg peak region of primary and secondary processes. ► We considered the corrections of incident particle energy focusing on the Rudds semi-empirical model. ► We calculated the electronic and nuclear stopping power, and we deduced the total stopping power. ► We calculated the stopping power of the secondary electrons.

Simulation and analysis of secondary emission microwave electron gun

International Nuclear Information System (INIS)

He Wencan; Pei Yuanji; Jin Kai; Wu Congfeng

2001-01-01

The development of high-current, short-duration pulses of electrons has been a challenging problem for many year. Micro-pulse-gun (MPG) is a novel concept that employs the resonant amplification of an electron current by secondary electron emission in a RE cavity. Using the computation code URMEL-T, several kinds of RF cavities under the frequency of 2856 MHz were calculated and optimized, the magnetic and electric field distribution in them were got. Through particle-in-cell (PIC) simulation, the self-bunching process in a MPG was proved, the relationship between the cavity length and selected phase and the relationship between the peak electric field and selected phase were got. With cathode material of high secondary emission coefficient, the MPG can produce high current densities (1132-5303 A/cm 2 ) and short pulses (3.15-10 ps)

Bio/Nano Electronic Devices and Sensors

National Research Council Canada - National Science Library

Jones, W. K

2008-01-01

...) Cold cathode microwave generator and ceramic electron multiplier-ceramic multiplier using a novel secondary electron yield materials of MgO and CNT was demonstrated as well as cooling structures...

Electron beam effects in auger electron spectroscopy and scanning electron microscopy

International Nuclear Information System (INIS)

Fontaine, J.M.; Duraud, J.P.; Le Gressus, C.

1979-01-01

Electron beam effects on Si(100) and 5% Fe/Cr alloy samples have been studied by measurements of the secondary electron yield delta, determination of the surface composition by Auger electron spectroscopy and imaging with scanning electron microscopy. Variations of delta as a function of the accelerating voltage Esub(p) (0.5 -9 Torr has no effect on technological samples covered with their reaction layers; the sensitivities to the beam depend rather on the earlier mechanical, thermal and chemical treatment of the surfaces. (author)

Effect of secondary electron emission on subnanosecond breakdown in high-voltage pulse discharge

Science.gov (United States)

Schweigert, I. V.; Alexandrov, A. L.; Gugin, P.; Lavrukhin, M.; Bokhan, P. A.; Zakrevsky, Dm E.

2017-11-01

The subnanosecond breakdown in open discharge may be applied for producing superfast high power switches. Such fast breakdown in high-voltage pulse discharge in helium was explored both in experiment and in kinetic simulations. The kinetic model of electron avalanche development was developed using PIC-MCC technique. The model simulates motion of electrons, ions and fast helium atoms, appearing due to ions scattering. It was shown that the mechanism responsible for ultra-fast breakdown development is the electron emission from cathode. The photoemission and emission by ions or fast atoms impact is the main reason of current growth at the early stage of breakdown, but at the final stage, when the voltage on discharge gap drops, the secondary electron emission (SEE) is responsible for subnanosecond time scale of current growth. It was also found that the characteristic time of the current growth τS depends on the SEE yield of the cathode material. Three types of cathode material (titanium, SiC, and CuAlMg-alloy) were tested. It is shown that in discharge with SiC and CuAlMg-alloy cathodes (which have enhanced SEE) the current can increase with a subnanosecond characteristic time as small as τS = 0.4 ns, for the pulse voltage amplitude of 5- 12 kV..

Ion-induced secondary electron emission, optical and hydration resistant behavior of MgO, Mg–Mo–O and Mg–Ce–O thin films

International Nuclear Information System (INIS)

Kumar, Ashok; Thota, Subhash; Deva, Dinesh; Kumar, Jitendra

2014-01-01

Optical transmittance, hydration resistance and secondary electron emission characteristics of e-beam evaporated pure and Mo- or Ce-containing MgO thin films have been investigated. While the increased grain size and pyramidal columnar morphology following incorporation of molybdenum and cerium in MgO are responsible for the excellent discharge characteristics, emergence of neutral {100} and {110} MgO surfaces preferentially give rise to high optical transmittance (∼ 92–100%) and stability against hydration. Further, addition of Mo (or Ce) in MgO causes significant increase in defect density which, in turn, enhances the photoluminescence (PL) emission from 5-, 4- and 3-coordination sites. The changes lead to lowering of the breakdown voltage and hence improvement in the secondary electron emission (SEE) efficiency. These facts have been supported by ion-induced SEE yield (γ) deduced from the a.c. breakdown voltage observed, taking neon as a discharge gas, and determined semi-empirically as well with Hagstrum's theory based on Auger neutralization process using (i) band offset parameters and surface band gap data derived from X-ray photoelectron spectroscopy signal and (ii) information of defect energy levels obtained from photoluminescence (PL) measurements. The experimental values of neon ion-induced SEE yield (γ) are found to be 0.35, 0.42 and 0.39 for MgO, Mg–Mo–O (x = 0.035) and Mg–Ce–O (x = 0.01) thin films, respectively. - Highlights: • Higher hydration resistance • Increased photoluminescence emission • Higher secondary electron emission

Determination of the secondary electron equilibrium using an extrapolation chamber

International Nuclear Information System (INIS)

Marshall, E.T.; Vaziri, K.; Krueger, F.P.; Cossairt, J.D.

1996-09-01

To ensure that the external personnel dosimetry program conducted by U. S. Department of Energy (DOE) contractors is of the highest quality, the DOE established the Department of Energy Laboratory Accreditation Program or DOELAP. The contractor's dosimetry program is assessed against the criteria set forth for dosimeter performance and the associated quality assurance and calibration programs. Although personnel dosimeters are not processed or calibrated by Fermilab, a proactive quality assurance program is in place to ensure accurate monitoring. This program includes quarterly blind testing of the dosimeters used by personnel. During the on-site assessment conducted of Fermilab's external dosimetry program during May 1994, an observation with regard to equipment maintenance and calibration was made: ''calibration personnel should probably review the electron secondary equilibrium needs at various irradiation distances from the 137 Cs irradiation systems'' The majority of the secondary electrons are generated through interactions of the beam with the collimator. Secondary electrons increase the low energy component of the radiation field, increasing the shallow doses measured. For dosimetric purposes, this increase needs to be defined so appropriate corrections to calculations or modifications to the facility can be made. Prompted by this observation, a study was designed to investigate the electron secondary equilibrium in the facility used for the blind testing by determining the dose equivalent as a function of depth in a tissue-equivalent medium. This presentation summarizes the methodology utilized and results of the investigation

Neutron yield from thick lead target by the action of high-energy electrons

International Nuclear Information System (INIS)

Noga, V.I.; Ranyuk, Yu.N.; Telegin, Yu.N.; Sorokin, P.V.

1978-01-01

The results are presented of studying the complete neutron yield from a lead target bombarded by high-energy electrons. Neutrons were recorded by the method of radio-active indicators. The dependence of the neutron yield on the target thickness varying from 0.2 to 8 cm was obtained at the energies of electrons of 230 and 1200 MeV. The neutron yield for the given energies with the target of 6 cm in thickness is in the range of saturation and is 0.1 +-0.03 and 0.65+-0.22 (neutr./MeV.el.), respectively. The neutron angular distributions were measured for different thicknesses of targets at the 201, 230 and 1200 MeV electrons. Within the error limits the angular distributions are isotropic. The dependence of neutron yield on the electron energy was examined for a 3 cm thick target. In the energy range of 100-1200 MeV these values are related by a linear dependence with the proportionality coefficient C=3x10 -4 (neutr./MeV.el.)

Calculated yields of ammonia in the radiolysis of deoxygenated solutions of glycylglycine

International Nuclear Information System (INIS)

Bolch, W.E.; Turner, J.E.; Yoshida, H.; Jacobson, K.B.

1988-01-01

This paper presents detailed Monte Carlo simulations of physical and chemical interactions occurring within electron tracks in deoxygenated solutions of glycylglycine. Hydrated electrons produced within these tracks react with the solute to produce ammonia and a peptide secondary free radical. Calculated yields of ammonia are presented for a range of solute concentrations and electron energies. Excellent agreement is found between calculated and measured yields of ammonia in solutions irradiated by 250-kVp x-rays and 60 Co gamma rays. 12 refs., 5 figs

Secondary-electron yield from Au induced by highly charged Ta ions

Czech Academy of Sciences Publication Activity Database

Krása, Josef; Láska, Leoš; Stöckli, M. P.; Fry, D.

2001-01-01

Roč. 173, - (2001), s. 281-286 ISSN 0168-583X R&D Projects: GA AV ČR IAA1010819 Institutional research plan: CEZ:AV0Z1010914 Keywords : highly charged ion-surface interaction * ion-induced electron emission * angle impact effect Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.041, year: 2001

Secondary electron emission induced by channeled relativistic electrons in a (1 1 0) Si crystal

International Nuclear Information System (INIS)

Korotchenko, K.B.; Kunashenko, Yu P.; Tukhfatullin, T.A.

2012-01-01

A new effect that accompanies electrons channeled in a crystal is considered. This phenomenon was previously predicted was called channeling secondary electron emission (CSEE). The exact CSEE cross-section on the basis of using the exact Bloch wave function of electron channeled in a crystal is obtained. The detailed investigation of CSEE cross-section is performed. It is shown that angular distribution of electrons emitted due to CSEE has a complex form.

Electron Cloud Parameterization Studies in the LHC

CERN Document Server

Dominguez, O; Baglin, V; Bregliozzi, G; Jimenez, J M; Metral, E; Rumolo, G; Schulte, D; Zimmermann, F

2011-01-01

During LHC beam commissioning with 150, 75 and 50-ns bunch spacing, important electron-cloud effects, like pressure rise, cryogenic heat load, beam instabilities or emittance growth, were observed. The main strategy to combat the LHC electron cloud, defined about ten years ago, relies on the surface conditioning arising from the chamber-surface bombardment with cloud electrons. In a standard model, the conditioning state of the beam-pipe surface is characterized by three parameters: 1. most importantly, the secondary emission yield δmax; 2. the incident electron energy at which the yield is maximum, ε_max; and 3. the probability of elastic reflection of low-energy primary electrons hitting the chamber wall, R. Since at the LHC no in-situ secondary-yield measurements are available, we compare the relative local pressure-rise measurements taken for different beam configurations against simulations in which surface parameters are scanned. This benchmarking of measurements and simulations is used to infer the s...

Chemical Vapor-Deposited (CVD) Diamond Films for Electronic Applications

Science.gov (United States)

1995-01-01

Diamond films have a variety of useful applications as electron emitters in devices such as magnetrons, electron multipliers, displays, and sensors. Secondary electron emission is the effect in which electrons are emitted from the near surface of a material because of energetic incident electrons. The total secondary yield coefficient, which is the ratio of the number of secondary electrons to the number of incident electrons, generally ranges from 2 to 4 for most materials used in such applications. It was discovered recently at the NASA Lewis Research Center that chemical vapor-deposited (CVD) diamond films have very high secondary electron yields, particularly when they are coated with thin layers of CsI. For CsI-coated diamond films, the total secondary yield coefficient can exceed 60. In addition, diamond films exhibit field emission at fields orders of magnitude lower than for existing state-of-the-art emitters. Present state-of-the-art microfabricated field emitters generally require applied fields above 5x10^7 V/cm. Research on field emission from CVD diamond and high-pressure, high-temperature diamond has shown that field emission can be obtained at fields as low as 2x10^4 V/cm. It has also been shown that thin layers of metals, such as gold, and of alkali halides, such as CsI, can significantly increase field emission and stability. Emitters with nanometer-scale lithography will be able to obtain high-current densities with voltages on the order of only 10 to 15 V.

Relations of secondary electron emission to microdosimetry and applications to two-target theory

International Nuclear Information System (INIS)

Forsberg, B.J.; Burlin, T.E.

1978-01-01

Secondary electron emission has been suggested as a phenomenon that offers considerable potential for microdosimetric studies (Burlin, 1973). This potential is examined further through a theoretical study. Previous work on the stochastic nature of secondary electron emission is reviewed and in particular a Monte Carlo programme of McDonald, Lamki and Delaney (1971, 1973) is developed. Lineal energy distributions are presented for tissue equivalent volumes of about 5nm in three materials for different electron energies. The dose mean of lineal energy and the frequency mean of lineal energy are calculated and these results for volumes with linear dimension of a few nanometers are compared with results of Bengtsson and Lindborg (1974), Braby and Ellett (1971) and Dvorak (1975). Several authors have suggested that some radiobiological effects may result from energy deposition in two different targets. An experimental investigation using proportional counter measurements to simulate two-target theory has been reported. In this paper an alternative technique to twin-proportional counter measurements, based on the secondary electron emission from the two sides of a thin foil is discussed. The extended version of the programme calculates the coincident P(nsub(i),nsub(e)) distribution, that is the number of secondary electrons pair (nsub(i), nsub(e)) is recorded, where nsub(i) is the number of secondary electrons leaving the incident side and nsub(e) is leaving the exit side of the foil simultaneously

Self-sputtering runaway in high power impulse magnetron sputtering: The role of secondary electrons and multiply charged metal ions

International Nuclear Information System (INIS)

Anders, Andre

2008-01-01

Self-sputtering runaway in high power impulse magnetron sputtering is closely related to the appearance of multiply charged ions. This conclusion is based on the properties of potential emission of secondary electrons and energy balance considerations. The effect is especially strong for materials whose sputtering yield is marginally greater than unity. The absolute deposition rate increases ∼Q 1/2 , whereas the rate normalized to the average power decreases ∼Q -1/2 , with Q being the mean ion charge state number

Secondary scintillation yield of xenon with sub-percent levels of CO2 additive for rare-event detection

Science.gov (United States)

Henriques, C. A. O.; Freitas, E. D. C.; Azevedo, C. D. R.; González-Díaz, D.; Mano, R. D. P.; Jorge, M. R.; Fernandes, L. M. P.; Monteiro, C. M. B.; Gómez-Cadenas, J. J.; Álvarez, V.; Benlloch-Rodríguez, J. M.; Borges, F. I. G. M.; Botas, A.; Cárcel, S.; Carríon, J. V.; Cebrían, S.; Conde, C. A. N.; Díaz, J.; Diesburg, M.; Esteve, R.; Felkai, R.; Ferrario, P.; Ferreira, A. L.; Goldschmidt, A.; Gutiérrez, R. M.; Hauptman, J.; Hernandez, A. I.; Hernando Morata, J. A.; Herrero, V.; Jones, B. J. P.; Labarga, L.; Laing, A.; Lebrun, P.; Liubarsky, I.; López-March, N.; Losada, M.; Martín-Albo, J.; Martínez-Lema, G.; Martínez, A.; McDonald, A. D.; Monrabal, F.; Mora, F. J.; Moutinho, L. M.; Muñoz Vidal, J.; Musti, M.; Nebot-Guinot, M.; Novella, P.; Nygren, D. R.; Palmeiro, B.; Para, A.; Pérez, J.; Querol, M.; Renner, J.; Ripoll, L.; Rodríguez, J.; Rogers, L.; Santos, F. P.; dos Santos, J. M. F.; Simón, A.; Sofka, C.; Sorel, M.; Stiegler, T.; Toledo, J. F.; Torrent, J.; Tsamalaidze, Z.; Veloso, J. F. C. A.; Webb, R.; White, J. T.; Yahlali, N.; NEXT Collaboration

2017-10-01

Xe-CO2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO2 to pure xenon at the level of 0.05-0.1% can reduce significantly the scale of electron diffusion from 10 mm /√{m} to 2.5 mm /√{m}, with high impact on the discrimination efficiency of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe-CO2 mixtures, with sub-percent CO2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO2.

Jean’s instability in a complex plasma in presence of secondary electrons and nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity Saumyen

2013-01-01

In this paper we have investigated the effect of secondary electron emission and nonthermality of ion velocity distribution simultaneously on Jean’s instability in a complex plasma in presence of negatively charged dust grains. Primary and secondary electron temperatures are assumed to be equal. Thus plasma under consideration consists of Boltzmann distributed electrons, nonthermal ions and negatively charged dust grains. The dust grain component is modeled by continuity and momentum equations. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically it is found that for lower values of the nonthermal parameter Jean’s instability is higher for higher secondary electron emission whereas the effect of secondary electron emission on Jean’s instability becomes insignificant for higher values of the nonthermal parameter. (author)

Measurement of activity yields for 12C(#betta#, n)11C, 14N(#betta#, n)13N, and 16O(#betta#, n)15O reactions as a function of electron beam energy and angle from the electron beam using thick target produced bremsstrahlung

International Nuclear Information System (INIS)

Piltingsrud, H.V.

1983-01-01

The calculation of activity yields from practical photonuclear target systems designed to produce short-lived positron emitting radionuclides for nuclear medicine purposes requires certain basic information. These include a knowledge of the photon source (bremsstrahlung energy spectrum and intensity as a function of angle from the electron beam) and the #betta#, n activation cross section of the secondary target element. A lack of adequate information concerning these parameters motivated the present study in which activity yields for the reactions 12 C(#betta#, n) 11 C, 14 N(#betta#, n) 13 N, and 16 O(#betta#, n) 15 O were measured as a function of energy of and angle from the electron beam between 16 and 30 MeV and 0 0 and 30.5 0 , respectively. The data indicate highly complex relationships between the activity yield and the experimental variables. Also indicated are possible applications of the data to indicate the energy of an electron beam producing a given bremsstrahlung field in which activation measurements are made

High-stable secondary-emission monitor for accelerated electron beam current

International Nuclear Information System (INIS)

Prudnikov, I.A.; Saksaganskij, G.L.; Bazhanov, E.B.; Zabrodin, B.V.

1977-01-01

A secondary-emission monitor for a 10 to 30 MeV electron beam (beam current is 10 -4 to 10 -2 A) is described. The monitor comprises a measuring electrode unit, titanium discharge-type pump, getter made of porous titanium, all enclosed in a metal casing. The measuring unit comprises three electrodes made of 20 μm aluminium foil. The secondary emission coefficient (5.19%+-0.06% for the electron energy of 20 MeV) is maintained stable for a long time. The monitor detects pulses of up to some nanoseconds duration. It is reliable in operation, and is recommended for a wide practical application

Observation of reduction of secondary electron emission from helium ion impact due to plasma-generated nanostructured tungsten fuzz

International Nuclear Information System (INIS)

Hollmann, E M; Doerner, R P; Nishijima, D; Pigarov, A Yu

2017-01-01

Growth of nanostructured fuzz on a tungsten target in a helium plasma is found to cause a significant (∼3×) reduction in ion impact secondary electron emission in a linear plasma device. The ion impact secondary electron emission is separated from the electron impact secondary electron emission by varying the target bias voltage and fitting to expected contributions from electron impact, both thermal and non-thermal; with the non-thermal electron contribution being modeled using Monte-Carlo simulations. The observed (∼3×) reduction is similar in magnitude to the (∼2×) reduction observed in previous work for the effect of tungsten fuzz formation on secondary electron emission due to electron impact. It is hypothesized that the observed reduction results from re-absorption of secondary electrons in the tungsten fuzz. (paper)

The trajectories of secondary electrons in the scanning electron microscope.

Science.gov (United States)

Konvalina, Ivo; Müllerová, Ilona

2006-01-01

Three-dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart-Thornley detector of SE and to reveal fundamental rules for tailoring the set-ups in which efficient signal acquisition can be expected. Intuitive realizations about the easiness of attracting the SEs towards the biased front grid of the detector have shown themselves likely as false, and all grounded objects in the chamber have been proven to influence the spatial distribution of the signal-extracting field. The role of the magnetic field penetrating from inside the objective lens is shown to play an ambiguous role regarding possible support for the signal collection.

Enhancement of the incoherent scattering plasma lines due to precipitating protons and secondary electrons

International Nuclear Information System (INIS)

Bjoernaa, N.; Havnes, O.; Jensen, J.O.; Trulsen, J.

1982-01-01

Precipitating protons in the energy range 1-100 keV are regularly present in the auroral ionosphere. These protons will produce enhancements in the intensity of the upshifted plasma line of the incoherently scattered spectrum. Similarly, secondary electrons produced by the precipitating protons give rise to enhanced plasma line intensities. For a quantitative discussion of these effects an experimentally measured proton flux is adapted and the corresponding secondary electron flux calculated. These particle fluxes are then applied in connection with the EISCAT radar facility. Both fluxes give rise to enhancements of the order of 20. It is possible to separate between proton and electron contributions to the enhanced plasma lines for scattering heights above the source region of secondary electrons. (Auth.)

Density and energy distribution of epithermal secondary electrons in a plasma with fast charged particles

International Nuclear Information System (INIS)

Jayakumar, R.; Fleischmann, H.H.

1989-01-01

The production of intermediate energy secondary electrons in plasmas through collisions with fast charged particles is investigated. The density and the distribution of the secondary electrons are obtained by calculating the generation, slow down and diffusion rates, using basic Rutherford collision cross sections. It is shown that the total density of secondaries is much smaller than the fast particle density and that the energy distribution has roughly a 1/√E dependence. The higher generation secondary populations are also obtained. (orig.)

On Secondary Electron Emission from Solid H2 and D2

DEFF Research Database (Denmark)

Schou, Jørgen; Sørensen, H.

1978-01-01

The emission of secondary electrons from solid hydrogen (H2 , D2, T2) is often considered to be of importance for the interaction between a fusion plasma and pellets of solid hydrogens. A set-up was therefore built for studies of interactions between energetic particles and solid hydrogens. Studies...... of secondary electron emission (SEE) from solid H2 and D2 were made for incidence of electrons up to 3 keV and for incidence of ions of hydrogen, deuterium, and helium up to 10 keV. The measurements were made for normal incidence, and in some cases also for oblique incidence. The SEE coefficients for solid H2...... is always 0.65-0.70 times that for solid D2. This difference is attributed to different losses to vibrational states in H2 and D2 for the low energy electrons. Measurements were also made on solid para-H2 with both electrons and hydrogen ions. There was no difference from the results for normal H2, which...

Electron Processing at 50 eV of Terphenylthiol Self-Assembled Monolayers: Contributions of Primary and Secondary Electrons.

Science.gov (United States)

Houplin, Justine; Dablemont, Céline; Sala, Leo; Lafosse, Anne; Amiaud, Lionel

2015-12-22

Aromatic self-assembled monolayers (SAMs) can serve as platforms for development of supramolecular assemblies driven by surface templates. For many applications, electron processing is used to locally reinforce the layer. To achieve better control of the irradiation step, chemical transformations induced by electron impact at 50 eV of terphenylthiol SAMs are studied, with these SAMs serving as model aromatic SAMs. High-resolution electron energy loss spectroscopy (HREELS) and electron-stimulated desorption (ESD) of neutral fragment measurements are combined to investigate electron-induced chemical transformation of the layer. The decrease of the CH stretching HREELS signature is mainly attributed to dehydrogenation, without a noticeable hybridization change of the hydrogenated carbon centers. Its evolution as a function of the irradiation dose gives an estimate of the effective hydrogen content loss cross-section, σ = 2.7-4.7 × 10(-17) cm(2). Electron impact ionization is the major primary mechanism involved, with the impact electronic excitation contributing only marginally. Therefore, special attention is given to the contribution of the low-energy secondary electrons to the induced chemistry. The effective cross-section related to dissociative secondary electron attachment at 6 eV is estimated to be 1 order of magnitude smaller. The 1 eV electrons do not induce significant chemical modification for a 2.5 mC cm(-2) dose, excluding their contribution.

Secondary emission coefficient dependence on the angle of incidence of primary electrons on CsI and LiF layers. [0. 9 to 3 keV, mechanism

Energy Technology Data Exchange (ETDEWEB)

Shabel' nikova, A E; Yasnopol' skii, N L

1976-08-01

The angular dependence was studied of the secondary emission coefficient sigma for CsI and LiF dielectrics which have large sigma in conditions of normal incidence of primary electrons. Measurements were taken down to the angle of 85 deg for energies of primary electrons between 0.9 and 3 keV. In the whole range of angles a nonmonotonic angular dependence sigma is observed. The dependence shows itself particularly clearly for CsI at large energies of primary electrons. Such a behaviour is due to the decrease in the depth of yield of inelastically reflected electrons and to the increase in the inelastic reflection coefficient of the substance.

Effect of Cs and Li atom adsorption on MgO: Secondary emission and work function

International Nuclear Information System (INIS)

Bagraev, N.T.; Borisov, V.L.

1980-01-01

Adsorption of Cs and Li atoms on the surface of single crystal magnesium oxide films has been investigated using Auger, LEED and contact difference techniques. A decreased work function for a single crystal MgO film grown on the Mo (100) face was observed to be accompanied by an increased secondary electron emission yield shown to be due to a larger escape depth for secondary electrons. LEED showed well ordered layers of adsorbed Cs on the MgO film surface. A model to explain the behaviour of Cs atoms on the film surface is proposed. It is shown that the stability of the Cs coating is not dependent on a prolonged bombardment of the film by incident electron beams of high current density. Depositing and implanting of thin single crystal MgO films with Li were found to result in an increased secondary electron emission yield, with Li adsorption on the MgO film surface being disordered. (orig.)

Numerical Simulations for the Beam-Induced Electron Cloud in the LHC Beam Screen

CERN Document Server

Brüning, Oliver Sim

1998-01-01

The following work summarises simulation results obtained at CERN for the beam-induced electron cloud and looks at possible cures for the heat load in the LHC beam screen. The synchrotron radiation in the LHC creates a continuous flow of photoelectrons. These electrons are accelerated by the electric field of the bunch and hit the vacuum chamber on the opposite side of the beam pipe where they crea te secondary electrons which are again accelerated by the next bunch. For a large secondary emission yield the above mechanism leads to an exponential growth of the electron cloud which is limited by space charge forces. The simulations use a two-dimensional mesh for the space charge calculations and include the effect of image charges on the vacuum chamber wall. Depending on the quantum yield for the production of photoelectrons, the secondary emission yield and the reflectivity, the heat load can vary from 0.1 W/m to more than 15 W/m.

Thermalization of secondary electrons under AMSGEMP conditions

International Nuclear Information System (INIS)

Bloomberg, H.W.; Pine, V.W.

1984-01-01

A Monte Carlo algorithm is used to determine the time behavior of source secondary electrons for ranges of the electric field to pressure ratio E/p of interest in AMSGEMP. The algorithm contains a very detailed cross section set describing electron interactions with the background gas. The authors show that the delay in the attainment of the peak time independent ionization frequency (or ionization coefficient) may result in negligible ionization over times of interest. In any case the behavior is shown to behave much differently than in examples where limited cross section sets, common in currently employed predictive codes, are employed. In particular, the importance of momentum transfer is indicated. A critique of the scaling implications of the phenomena is made

Contrasting response of biomass and grain yield to severe drought in Cappelle Desprez and Plainsman V wheat cultivars

Directory of Open Access Journals (Sweden)

Kenny Paul

2016-02-01

Full Text Available We report a case study of natural variations and correlations of some photosynthetic parameters, green biomass and grain yield in Cappelle Desprez and Plainsman V winter wheat (Triticum aestivum L. cultivars, which are classified as being drought sensitive and tolerant, respectively. We monitored biomass accumulation from secondary leaves in the vegetative phase and grain yield from flag leaves in the grain filling period. Interestingly, we observed higher biomass production, but lower grain yield stability in the sensitive Cappelle cultivar, as compared to the tolerant Plainsman cv. Higher biomass production in the sensitive variety was correlated with enhanced water-use efficiency. Increased cyclic electron flow around PSI was also observed in the Cappelle cv. under drought stress as shown by light intensity dependence of the ratio of maximal quantum yields of Photosystem I and Photosystem II, as well by the plot of the Photosystem I electron transport rate as a function of Photosystem II electron transport rate. Higher CO2 uptake rate in flag leaves of the drought-stressed Plainsman cv. during grain filling period correlates well with its higher grain yield and prolonged transpiration rate through spikes. The increase in drought factor (DFI and performance (PI indices calculated from variable chlorophyll fluorescence parameters of secondary leaves also showed correlation with higher biomass in the Cappelle cultivar during the biomass accumulation period. However, during the grain filling period, DFI and PI parameters of the flag leaves were higher in the tolerant Plainsman V cultivar and showed correlation with grain yield stability. Our results suggest that overall biomass and grain yield may respond differentially to drought stress in different wheat cultivars and therefore phenotyping for green biomass cannot be used as a general approach to predict grain yield. We also conclude that photosynthetic efficiency of flag and secondary leaves

Formula for average energy required to produce a secondary electron in an insulator

International Nuclear Information System (INIS)

Xie Ai-Gen; Zhan Yu; Gao Zhi-Yong; Wu Hong-Yan

2013-01-01

Based on a simple classical model specifying that the primary electrons interact with the electrons of a lattice through the Coulomb force and a conclusion that the lattice scattering can be ignored, the formula for the average energy required to produce a secondary electron (in) is obtained. On the basis of the energy band of an insulator and the formula for in, the formula for the average energy required to produce a secondary electron in an insulator (in i ) is deduced as a function of the width of the forbidden band (E g ) and electron affinity χ. Experimental values and the in i values calculated with the formula are compared, and the results validate the theory that explains the relationships among E g , χ, and in i and suggest that the formula for in i is universal on the condition that the primary electrons at any energy hit the insulator. (condensed matter: electronic structure, electrical, magnetic, and optical properties)

Calculation of the total electron excitation cross section in the Born approximation using Slater wave functions for the Li (2s yields 2p), Li (2s yields 3p), Na (3s yields 4p), Mg (3p yields 4s), Ca (4s yields 4p) and K (4s yields 4p) excitations. M.S. Thesis

Science.gov (United States)

Simsic, P. L.

1974-01-01

Excitation of neutral atoms by inelastic scattering of incident electrons in gaseous nebulae were investigated using Slater Wave functions to describe the initial and final states of the atom. Total cross sections using the Born Approximation are calculated for: Li(2s yields 2p), Na(3s yields 4p), k(4s yields 4p). The intensity of emitted radiation from gaseous nebulae is also calculated, and Maxwell distribution is employed to average the kinetic energy of electrons.

A photomultiplier-based secondary electron imaging system for a nuclear microprobe

International Nuclear Information System (INIS)

Alves, L.C.; Breese, M.B.H.; Silva, M.F. da; Soares, J.C.

2002-01-01

The ability to define, or recognise particular regions of interest or surface features is vital to the analysis and interpretation of spatially-resolved images collected with a nuclear microprobe. However, good topographic image contrast is difficult to accomplish using PIXE or RBS images due to their inherent insensitivity to topography, lack of elemental variation or poor statistics. Topographic image contrast is commonly obtained in scanning electron microscopy (SEM) by detecting a large flux of secondary electrons produced by the focused keV electron beam. Similar systems have not been widely used on nuclear microprobes due to ion beam intensity fluctuations, which limit the minimum resolvable contrast and present a major limitation for this technique. This paper describes a secondary electron imaging system which has been developed on the Lisbon microprobe. It is based on a scintillator, a photomultiplier operated in a pulsed mode, a pulse shaping electronic chain and ADC, and requires no changes to the existing data acquisition system. Examples of the images obtained from materials such as patterned SiGe wafers and hydrogen-implanted silicon are given, and compared with SEM or optical images

An AES Study of the Room Temperature Surface Conditioning of Technological Metal Surfaces by Electron Irradiation

CERN Document Server

Scheuerlein, C; Taborelli, M; Brown, A; Baker, M A

2002-01-01

The modifications to technological copper and niobium surfaces induced by 2.5 keV electron irradiation have been investigated in the context of the conditioning process occurring in particle accelerator ultra high vacuum systems. Changes in the elemental surface composition have been found using Scanning Auger Microscopy (SAM) by monitoring the carbon, oxygen and metal Auger peak intensities as a function of electron irradiation in the dose range 10-6 to 10-2 C mm-2. The surface analysis results are compared with electron dose dependent secondary electron and electron stimulated desorption yield measurements. Initially the electron irradiation causes a surface cleaning through electron stimulated desorption, in particular of hydrogen. During this period both the electron stimulated desorption and secondary electron yield decrease as a function of electron dose. When the electron dose exceeds 10-4 C mm-2 electron stimulated desorption yields are reduced by several orders of magnitude and the electron beam indu...

Study of a high power hydrogen beam diagnostic based on secondary electron emission

Energy Technology Data Exchange (ETDEWEB)

Sartori, E., E-mail: emanuele.sartori@igi.cnr.it [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy); Department of Management and Engineering, University di Padova strad. S. Nicola 3, 36100 Vicenza (Italy); Panasenkov, A. [NRC, Kurchatov Institute, 1, Kurchatov Sq, Moscow 123182 (Russian Federation); Veltri, P. [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy); INFN-LNL, viale dell’Università n. 2, 35020 Legnaro (Italy); Serianni, G.; Pasqualotto, R. [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy)

2016-11-15

In high power neutral beams for fusion, beam uniformity is an important figure of merit. Knowing the transverse power profile is essential during the initial phases of beam source operation, such as those expected for the ITER heating neutral beam (HNB) test facility. To measure it a diagnostic technique is proposed, based on the collection of secondary electrons generated by beam-surface and beam-gas interactions, by an array of positively biased collectors placed behind the calorimeter tubes. This measurement showed in the IREK test stand good proportionality to the primary beam current. To investigate the diagnostic performances in different conditions, we developed a numerical model of secondary electron emission, induced by beam particle impact on the copper tubes, and reproducing the cascade of secondary emission caused by successive electron impacts. The model is first validated against IREK measurements. It is then applied to the HNB case, to assess the locality of the measurement, the proportionality to the beam current density, and the influence of beam plasma.

Excess energy partitioning between electrons departing at 0o and 180o in the ionization of helium near threshold

International Nuclear Information System (INIS)

Asmis, K.R.; Allan, M.

1997-01-01

Partitioning of excess energy between electrons departing at 0 o and 180 o after electron-impact ionization of helium has been measured. A recently developed scheme, using a magnetically collimated electron-impact spectrometer, pulsed incident electron beam and time-of-flight detection was used to detect the electrons departing in the forward and backward directions. The ratios of the forward and backward doubly differential cross-sections (DDCS) for an incident electron energy 3 eV above threshold and secondary electron energies of 0.7, 1.5 and 2.9 eV were measured. The relative DDCS at 0 o and 180 o are also presented as a function of the secondary electron energy, for incident electron energies 3 and 5 eV above threshold. Our measurements show that the distribution of the secondary electrons is, in contrast to electrons detected at 90 o , not flat for electrons departing at 0 o and 180 o at the present low primary energies. The yield of the faster secondary electrons is forward peaked, the yield of the slower secondary electrons is backward peaked. The sum of the 0 o and 180 o DDCS is, however, flat within the experimental uncertainty limits. (Author)

Process and device of elementary and chemical analysis of a sample through a spectral analysis of the secondary electron energies

International Nuclear Information System (INIS)

Le Gressus, Claude; Massignon, Daniel; Sopizet, Rene.

1975-01-01

The present invention relates to a method of chemical and elementary analysis of samples through a spectral analysis of secondary electrons (Auger electrons) emitted from said sample under a primary monokinetic electron beam concentrated on its surface. Said method is characterized in that the intensity of the primary monokinetic electron beam emitted from an electron gun is modulated at a frequency ω; and in that the secondary electrons of energy E emitted from the sample are then collected. A reference voltage corresponding to the modulation in intensity of the primary electron beam is applied at the input of a phase sensitive detector together with a voltage proportional to the intensity of the flux of said collected secondary electrons to obtain at the output of said detector a voltage proportional to the number of the secondary electrons of energy E. The secondary emission energy spectrum of the sample is then plotted [fr

High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM.

Science.gov (United States)

Neděla, Vilém; Tihlaříková, Eva; Runštuk, Jiří; Hudec, Jiří

2018-01-01

A new Combined System for high-efficiency detection of Secondary and Backscattered Electrons (CSSBE) in the ESEM consists of three detectors: an ionisation SE detector, an improved scintillation BSE detector, and a new Ionisation Secondary Electron Detector with an electrostatic Separator (ISEDS). The ISEDS optimizes conditions for electron-gas ionisation phenomena in the ESEM to achieve a strongly amplified signal from the secondary electrons with a minimal contribution from backscattered and beam electrons. For this purpose, it is originally equipped with an electrostatic separator, which focuses signal electrons towards a detection electrode and controls the concentration of positive ions above the sample. The working principle of the ISEDS is explained by simulations of signal electron trajectories in gas using the EOD program with our Monte Carlo module. The ability to detect the signal electrons in a selected range of energies is described with Geant4 Monte Carlo simulations of electron-solid interactions and proven by experimental results. High-efficiency detection of the ISEDS is demonstrated by imaging a low atomic number sample under a reduced beam energy of 5 keV, very low beam currents of up to 0.2 pA, and gas pressure of hundreds of Pa. Copyright © 2017 Elsevier B.V. All rights reserved.

Electron mobility and saturation of ion yield in 2,2,4,4-tetramethylpentane

International Nuclear Information System (INIS)

Poffenberger, P.R.; Astbury, A.; Fincke-Keeler, M.; Keeler, R.K.; Li, Y.; Robertson, L.P.; Rosvick, M.; Schenk, P.; Oram, C.; Sobie, R.

1993-01-01

The electron drift mobility μ and zero field free ion yield G fi 0 have been measured for liquid 2,2,4,4-tetramethylpentane using a waveform analysis. The saturation of the ion yield for highly ionizing radiation has also been investigated and parameterized using the Birks' equation. The results obtained are μ=26.3±0.8 cm 2 /V s, G fi 0 =0.743±0.029 electrons/100 eV, and a Birks' factor ranging from kB=0.222±0.014 cm/MeV at 604 V/cm to kB=0.141±0.021 cm/MeV at 3625 V/cm. (orig.)

Laboratory study of nitrate photolysis in Antarctic snow. I. Observed quantum yield, domain of photolysis, and secondary chemistry

DEFF Research Database (Denmark)

Meusinger, Carl; Berhanu, Tesfaye A.; Erbland, Joseph

2014-01-01

undergoing secondary (recombination) chemistry. Modeled NOx emissions may increase significantly above measured values due to the observed quantum yield in this study. The apparent quantum yield in the 200 nm band was found to be ∼ 1%, much lower than reported for aqueous chemistry. A companion paper...... are understood. It has been shown that photolysis of nitrate in the snowpack plays a major role in nitrate loss and that the photolysis products have a significant influence on the local troposphere as well as on other species in the snow. Reported quantum yields for the main reaction spans orders of magnitude...

Radioisotope production with electron accelerators

International Nuclear Information System (INIS)

Brinkman, G.A.

1978-01-01

The production of radio isotopes with electron accelerators proceeds mainly by secondary photons (bremsstrahlung), produced in an interaction between the electrons and the Coulomb field of the nuclei of a converter. The production yields depend on: the initial electron energy, the Z and thickness of the bremsstrahlung-converter, the Z, A and the thickness of the target, the geometric set up and the cross section for a particular reaction. In this article the production is only considered for thin bremsstrahlung converters in combination with an electron 'sweep' magnet. Simple formulae are given for the calculations of production yields under standard conditions with only sigmasub(q) (the cross section per equivalent quantum) and f (the fraction of the photons that hit the target) as variables and for the calculations of the dose rate at the production point. The units in which the yields are expressed in the literature (units of sigmasub(q) dose, electron beam intensity, monitor response) are discussed. (Auth.)

INFLUENCE OF BLEACHING WITH OZONE AND PEROXIDO OF HYDROGEN IN THE YIELD AND QUALITY OF SECONDARY FIBERS

Directory of Open Access Journals (Sweden)

Gustavo Ventorim

2010-08-01

Full Text Available In this study, Total Chlorine Free (TCF bleaching processes were evaluated for bleaching a secondary fiber of different origens. The samples were bleached to a target brightness of 78 % ISO. The results were interpreted on the basis of chemical cost to reach the target brightness, bleaching yield and bleached pulp quality as measured by viscosity, fluorescence and b* color coordinate. The ozone stage was responsible for improve TCF bleaching performance. The pulp bleached by sequences contained a ozone stage followed by chelation, without interstage washing (ZQ, and a final hydrogen peroxide stage unpressurized (P or pressurized with oxygen (PO, designed as (ZQ(PO showed good results. These sequences decreased pulp b* coordinate significantly and fluorescence slightly. For  all three bleaching processes, it was determined that process yield is negatively affected by hot alkaline stages such as oxygen, O, peroxide, P, and peroxide pressurized with oxygen, (PO and also for the origin of the pulps of secondary fibers.

Electron beam irradiation enhances the digestibility and fermentation yield of water-soaked lignocellulosic biomass

Directory of Open Access Journals (Sweden)

Jin Seop Bak

2014-12-01

Full Text Available In order to overcome the limitation of commercial electron beam irradiation (EBI, lignocellulosic rice straw (RS was pretreated using water soaking-based electron beam irradiation (WEBI. This environment-friendly pretreatment, without the formation (or release of inhibitory compounds (especially hydroxymethylfurfural and furfural, significantly increased the enzymatic hydrolysis and fermentation yields of RS. Specifically, when water-soaked RS (solid:liquid ratio of 100% was treated with WEBI doses of 1 MeV at 80 kGy, 0.12 mA, the glucose yield after 120 h of hydrolysis was 70.4% of the theoretical maximum. This value was predominantly higher than the 29.5% and 52.1% measured from untreated and EBI-treated RS, respectively. Furthermore, after simultaneous saccharification and fermentation for 48 h, the ethanol concentration, production yield, and productivity were 9.3 g/L, 57.0% of the theoretical maximum, and 0.19 g/L h, respectively. Finally, scanning electron microscopy images revealed that WEBI induced significant ultrastructural changes to the surface of lignocellulosic fibers.

Effect of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity, Saumyen; Banerjee, Soumyajyoti

2011-01-01

In this paper, we have investigated the role of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions. The equilibrium dust surface potential has been considered negative and hence primary and secondary electron temperatures are equal. Such plasma consists of three components: Boltzman distributed electrons, nonthermal ions and negatively charged inertial dust grains. From the linear dispersion relation, we have calculated the real frequency and growth rate of Jean's instability. Numerically, we have shown that for strong ion nonthermality Jean's mode is unstable. Growth of the instability reduces and the real part of the wave frequency increases with increasing secondary electron emission from dust grains. Hence, strong secondary electron emission suppresses Jean's instability in a complex plasma even when ion nonthermality is strong and equilibrium dust charge is negative.

The Tynode: A new vacuum electron multiplier

Energy Technology Data Exchange (ETDEWEB)

Graaf, Harry van der, E-mail: vdgraaf@nikhef.nl [Delft University of Technology, Delft (Netherlands); Nikhef, Science Park 105, 1098 XG Amsterdam (Netherlands); Akhtar, Hassan; Budko, Neil; Chan, Hong Wah; Hagen, Cornelis W. [Delft University of Technology, Delft (Netherlands); Hansson, Conny C.T. [Delft University of Technology, Delft (Netherlands); Nikhef, Science Park 105, 1098 XG Amsterdam (Netherlands); Nützel, Gert; Pinto, Serge D. [Photonis, Roden (Netherlands); Prodanović, Violeta; Raftari, Behrouz; Sarro, Pasqualina M. [Delft University of Technology, Delft (Netherlands); Sinsheimer, John; Smedley, John [Brookhaven National Laboratory, Upton, NY 11973 (United States); Tao, Shuxia [Eindhoven University of Technology/DIFFER (Netherlands); Theulings, Anne M.M.G. [Delft University of Technology, Delft (Netherlands); Nikhef, Science Park 105, 1098 XG Amsterdam (Netherlands); Vuik, Kees [Delft University of Technology, Delft (Netherlands)

2017-03-01

By placing, in vacuum, a stack of transmission dynodes (tynodes) on top of a CMOS pixel chip, a single free electron detector could be made with outstanding performance in terms of spatial and time resolution. The essential object is the tynode: an ultra thin membrane, which emits, at the impact of an energetic electron on one side, a multiple of electrons at the other side. The electron yields of tynodes have been calculated by means of GEANT-4 Monte Carlo simulations, applying special low-energy extensions. The results are in line with another simulation based on a continuous charge-diffusion model. By means of Micro Electro Mechanical System (MEMS) technology, tynodes and test samples have been realized. The secondary electron yield of several samples has been measured in three different setups. Finally, several possibilities to improve the yield are presented.

Measurements of secondary electron cross sections by the pulsed electron beam time-of-flight method. I. Molecular nitrogen

International Nuclear Information System (INIS)

Goruganthu, R.R.; Wilson, W.G.; Bonham, R.A.

1983-01-01

The secondary electron cross sections for gaseous molecular nitrogen are reported at ejection angles of 30, 45, 60, 75, 90, 105, 120, 135 and 150 0 , for the energy range 1.5 eV to 20 eV and incident electron energy of 1 keV. The pulsed electron beam time-of-flight methd was employed. The results were placed on an absolute scale by normalization to the elastic scattering. They were compared, where possible, with those reported by Opal, Beaty, and Peterson (OBP). The agreement is somewhat better when the OBP data are divided by 0.53 + 0.47 sintheta as suggested by Rudd and DuBois. Fits of our data by Legendre-polynomial expansions are used to estimate the low-energy portion of the cross-section, dsigma/dE. This work suggests that existing experimental cross sections for secondary electron ejection as a function of angle and ejected energy may be no better known than +-40%, especially in the low energy region. 7 references, 14 figures, 2 tables

Test beam results of a low-pressure micro-strip gas chamber with a secondary-electron emitter

International Nuclear Information System (INIS)

Kwan, S.; Anderson, D.F.; Zimmerman, J.; Sbarra, C.; Salomon, M.

1994-10-01

We present recent results, from a beam test, on the angular dependence of the efficiency and the distribution of the signals on the anode strips of a low-pressure microstrip gas chamber with a thick CsI layer as a secondary-electron emitter. New results of CVD diamond films as secondary-electron emitters are discussed

Detection of secondary electrons with pixelated hybrid semiconductor detectors; Sekundaerelektronennachweis mit pixelierten hybriden Halbleiterdetektoren

Energy Technology Data Exchange (ETDEWEB)

Gebert, Ulrike Sonja

2011-09-14

Within the scope of this thesis, secondary electrons were detected with a pixelated semiconductor detector named Timepix. The Timepix detector consists of electronics and a sensor made from a semiconductor material. The connection of sensor and electronics is done for each pixel individually using bump bonds. Electrons with energies above 3 keV can be detected with the sensor. One electron produces a certain amount of electron-hole pairs according to its energy. The charge then drifts along an electric field to the pixel electronics, where it induces an electric signal. Even without a sensor it is possible to detect an electric signal from approximately 1000 electrons directly in the pixel electronics. Two different detector systems to detect secondary electrons using the Timepix detector were investigated during this thesis. First of all, a hybrid photon detector (HPD) was used to detect single photoelectrons. The HPD consists of a vacuum vessel with an entrance window and a cesium iodine photocathode at the inner surface of the window. Photoelectrons are released from the photocathode by incident light and are accelerated in an electric field towards the Timepix detector, where the point of interaction and the arrival time of the electron is determined. With a proximity focusing setup, a time resolution of 12 ns (with an acceleration voltage of 20 kV between photocathode and Timepix detector) was obtained. The HPD examined in this thesis showed a strong dependence of the dark rate form the acceleration voltage and the pressure in the vacuum vessel. At a pressure of few 10{sup -5} mbar and an acceleration voltage of 20 kV, the dark rate was about 800 Hz per mm{sup 2} area of the read out photocathode. One possibility to reduce the dark rate is to identify ion feedback events. With a slightly modified setup it was possible to reduce the dark rate to 0.5 Hz/mm{sup 2}. To achieve this, a new photocathode was mounted in a shorter distance to the detector. The

Particle mass yield in secondary organic aerosol formed by the dark ozonolysis of α-pinene

Directory of Open Access Journals (Sweden)

J. E. Shilling

2008-04-01

Full Text Available The yield of particle mass in secondary organic aerosol (SOA formed by dark ozonolysis was measured for 0.3–22.8 ppbv of reacted α-pinene. Most experiments were conducted using a continuous-flow chamber, allowing nearly constant SOA concentration and chemical composition for several days. For comparison, some experiments were also conducted in batch mode. Reaction conditions were 25°C, 40% RH, dry (NH₄SO₄ seed particles, and excess 1-butanol. The organic particle loading was independently measured by an aerosol mass spectrometer and a scanning mobility particle sizer, and the two measurements agreed well. The observations showed that SOA formation occurred for even the lowest reacted α-pinene concentration of 0.3 ppbv. The particle mass yield was 0.09 at 0.15 μg m⁻³, increasing to 0.27 at 40 μg m⁻³. Compared to some results reported in the literature, the yields were 80 to 100% larger for loadings above 2 μg m⁻³. At lower loadings, the yields had an offset of approximately +0.07 from those reported in the literature. To as low as 0.15 μm⁻³, the yield curve had no inflection point toward null yield, implying the formation of one or several products having vapor pressures below this value. These observations of increased yields, especially for low loadings, are potentially important for accurate prediction by chemical transport models of organic particle concentrations in the ambient atmosphere.

Low-energy electron transmission and secondary-electron emission experiments on crystalline and molten long-chain alkanes

International Nuclear Information System (INIS)

Ueno, N.; Sugita, K.; Seki, K.; Inokuchi, H.

1986-01-01

This paper describes the results of low-energy electron transmission and secondary-electron emission experiments on thin films of long-chain alkanes deposited on metal substrates. The spectral changes due to crystal-melt phase transition were measured in situ in both experiments. The ground-state energy V 0 of the quasifree electron in crystalline state was determined to be 0.5 +- 0.1 eV. The value of V 0 for the molten state was found to be negative. Further, in the crystalline state evidence is found for a direct correspondence between the transmission maxima and the high value of the density of states in the conduction bands

Secondary electron emission and its role in the space environment

Science.gov (United States)

Němeček, Z.; Pavlů, J.; Richterová, I.; Šafránková, J.; Vaverka, J.

2018-01-01

The role of dust in the space environment is of increasing interest in recent years and also the fast development of fusion devices with a magnetic confinement brought new issues in the plasma-surface interaction. Among other processes, secondary electron emission plays an important role for dust charging in interplanetary space and its importance increases at and above the surfaces of airless bodies like planets, moons, comets or asteroids. A similar situation can be found in many industrial applications where the dust is a final product or an unintentional impurity. The present paper reviews the progress in laboratory investigations of the secondary emission process as well as an evolution of the modeling of the interaction of energetic electrons with dust grains of different materials and sizes. The results of the model are discussed in view of latest laboratory simulations and they are finally applied on the estimation of an interaction of the solar wind and magnetospheric plasmas with the dust attached to or levitating above the lunar surface.

Irradiation of gold nanoparticles by x-rays: Monte Carlo simulation of dose enhancements and the spatial properties of the secondary electrons production.

Science.gov (United States)

Leung, Michael K K; Chow, James C L; Chithrani, B Devika; Lee, Martin J G; Oms, Barbara; Jaffray, David A

2011-02-01

The aim of this study is to understand the characteristics of secondary electrons generated from the interaction of gold nanoparticles (GNPs) with x-rays as a function of nanoparticle size and beam energy and thereby further the understanding of GNP-enhanced radiotherapy. The effective range, deflection angle, dose deposition, energy, and interaction processes of electrons produced from the interaction of x-rays with a GNP were calculated by Monte Carlo simulations. The GEANT4 code was used to simulate and track electrons generated from a 2, 50, and 100 nm diameter GNP when it is irradiated with a 50 kVp, 250 kVp, cobalt-60, and 6 MV photon beam in water. When a GNP was present, depending on the beam energies used, secondary electron production was increased by 10- to 2000-fold compared to an absence of a GNP. Low-energy photon beams were much more efficient at interacting with the GNP by two to three orders of magnitude compared to MV energies and increased the deflection angle. GNPs with larger diameters also contributed more dose. The majority of the energy deposition was outside the GNP, rather than self-absorbed by the nanoparticle. The mean effective range of electron tracks for the beams tested ranged from approximately 3 microm to 1 mm. These simulated results yield important insights concerning the spatial distributions and elevated dose in GNP-enhanced radiotherapy. The authors conclude that the irradiation of GNP at lower photon energies will be more efficient for cell killing. This conclusion is consistent with published studies.

Improved Electron Yield and Spin-Polarization from III-V Photocathodes Via Bias Enhanced Carrier Drift

International Nuclear Information System (INIS)

Mulhollan, Gregory A.; Bierman, John; Brachmann, Axel; Clendenin, James E.; Garwin, Edward; Kirby, Robert; Luh, Dah-An

2005-01-01

Spin-polarized electrons are commonly used in high energy physics. Future work will benefit from greater polarization. Polarizations approaching 90% have been achieved at the expense of yield. The primary paths to higher polarization are material design and electron transport. Our work addresses the latter. Photoexcited electrons may be preferentially emitted or suppressed by an electric field applied across the active region. We are tuning this forward bias for maximum polarization and yield, together with other parameters, e.g., doping profile. Preliminary measurements have been carried out on bulk and thin film GaAs. As expected, the yield change far from the bandgap is quite large for bulk material. The bias is applied to the bottom (non-activated) side of the cathode so that the accelerating potential as measured with respect to the ground potential chamber walls is unchanged for different front-to-back cathode bias values. The size of the bias to cause an appreciable effect is rather small reflecting the low drift kinetic energy in the zero bias case

Effect of Weakly Nonthermal Ion Velocity Distribution on Jeans Instability in a Complex Plasma in Presence of Secondary Electrons

International Nuclear Information System (INIS)

Sarkar, S.; Maity, S.

2013-01-01

In this paper we have investigated the effect of weak nonthermality of ion velocity distribution on Jean’s instability in a complex plasma in presence of secondary electrons and negatively charged dust grains. The primary and secondary electron temperatures are assumed equal. Thus plasma under consideration consists of three components: Boltzman distributed electrons, non-thermal ions and negatively charged inertial dust grains. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically we have found that secondary electron emission destabilizes Jean’s mode when ion nonthermality is weak. (author)

Secondary electron interactions in materials with environmental and radiological interest

International Nuclear Information System (INIS)

Garcia, G.; Blanco, F.; Pablos, J.L. de; Perez, J.M.; Williart, A.

2003-01-01

Important environmental and radiological applications require energy deposition models including the interactions between secondary electrons and the atoms or molecules of the medium. In this work we propose a method to obtain reliable cross-section data to be used in these models by combining total and ionization cross-section measurements with simple calculations of the differential and integral elastic cross-sections. The energy loss spectra obtained in this experiment have been also used to drive stopping power of the considered materials for electrons. Some examples of results for atomic (Xe) and molecular (CF 4 ) targets are presented and discussed in this paper. (author)

Photo-neutron yields from thin and thick targets irradiated by 2.0 GeV electrons

International Nuclear Information System (INIS)

Hee-Seock, Lee; Syuichi, Ban; Toshiya, Sanami; Kazutoshi, Takahashi; Tatsuhiko, Sato; Kazuo, Shin

2005-01-01

The photo-neutron yields from thin and thick targets irradiated by high energy electrons were studied. The photo-neutron spectra at 90 deg C relative to the incident 2.0 GeV electrons were measured by the pulsed beam time-of-flight technique using the Pilot-U plastic scintillator and the NE213 liquid scintillator with 2 inches in length and 2 inches in diameter. Targets, from low-Z element (carbon) to high-Z element (bismuth) and with thin (0.5 Xo) and thick (10 Xo) thickness, were used in this study. The differential photo-neutron yields between 2 MeV (mainly 8 MeV) and 400 MeV were obtained. The systematics was studied to make empirical yield terms for shielding application. Recently, the study of the angular distributed yields was conducted at two other observing angles, 48 deg C and 140 deg C. The photo-neutron yields between 8 MeV and 250 MeV were obtained for thick targets. The experimental data were compared with results calculated using the EGS4+PICA3 or the MCNPX 2.5d code. (authors)

Electron thermalization distances and free-ion yields in dielectric fluids: Effect of electron scavengers

International Nuclear Information System (INIS)

Gee, N.; Freeman, G.R.

1985-01-01

Free-ion yields were measured in isobutane and in solutions containing sulfur hexafluoride, at densities from the liquid at 295 K to the supercritical fluid. A modified Onsager model was used to estimate the most probable thermalization distances b/sub GP/ (GP denotes a Gaussian power-law distribution). The density-normalized distance b/sub GP/d in isobutane increased from 6.3 x 10 -6 kg/m 2 at 295 K to a maximum of 10.5 x 10 -6 kg/m 2 at 395 K, and then decreased to 5.6 x 10 -6 kg/m 2 at 408 K (T/sub c/). The maximum, which is evidence of conduction-band enhancement of b/sub GP/, was suppressed in solutions containing small amounts of SF 6 . The SF 6 captured the electrons while they were still at epithermal energies, and terminated their flight away from their sibling ions. The values of b/sub GP/ and the free-ion yields were thereby decreased

Total yield and escape depth of electrons from heavy ion solid interactions

International Nuclear Information System (INIS)

Frischkorn, H.J.; Burkhard, M.; Groenveld, K.O.; Hofmann, D.; Koschar, P.; Latz, R.; Schader, J.

1983-01-01

At high projectile energies ( aboutMeV/U) several mechanisms for electron production are discussed as e.g. direct ionization collisions, recoil particle cascades, collective electron emission. Results are presented of total electron yield (#betta#) measurements over a wide projectile energy E /SUB p/ range (40 keV/U< E /SUB p/ /M <12 MeV/U) and a wide projectile Z /SUB p/ range (1<2 /SUB p-/ <92) of both monoionic and molecular projectiles and of different target thicknesses. From the target thickness dependence of #betta# the mean free path lambda of electrons in carbon can be calculated. The data are discussed in the frame of current theories. Significant deviations from calculated values and predicted dependencies are found, in particular for projectile velocities v /SUB p/ close to the Fermi velocity v /SUB F/ of target electrons and for molecular projectile ions

Electron emission from materials at low excitation energies

International Nuclear Information System (INIS)

Urma, N.; Kijek, M.; Millar, J.J.

1996-01-01

Full text: An experimental system has been designed and developed with the purpose of measuring the total electron emission yield from materials at low energy excitation. In the first instance the reliability of the system was checked by measuring the total electron emission yield for a well defined surface (aluminium 99.45%). The obtained data was in the expected range given by the literature, and consequently the system will be used further for measuring the total electron yield for a range of materials with interest in the instrumentation industry. We intend to measure the total electron emission yield under electron bombardment as a function of incident electron energy up to 1200 eV, angle of incidence, state of the surface and environment to which the surface has been exposed. Dependence of emission on total electron irradiated dose is also of interest. For many practical application of the 'Secondary Electron Emission', the total electron yield is desired to be as large as possible. The above phenomenon has practical applicability in electron multiplier tube and Scanning electron microscopy - when by means of the variation of the yield of the emitted electrons one may produce visible images of small sample areas. The electron multiplier tube, is a device which utilises the above effect to detect and amplify both single particles and low currents streams of charged particles. The majority of electron tubes use electrons with low energy, hundreds of eV. Not a lot has been published in the literature about this regime and also about the emission when the impinging electrons have small energy, up to 1 KeV. The information obtained from the experimental measurements concerning the total electron emission yield is used to asses the investigated materials as a potential electron emitting surfaces or dynodes in an electron multiplier tube

Electron-cloud measurements and simulations for the APS

International Nuclear Information System (INIS)

Furman, M.A.; Pivi, M.; Harkay, K.C.; Rosenberg, R.A.

2001-01-01

We compare experimental results with simulations of the electron cloud effect induced by a positron beam at the APS synchrotron light source at ANL, where the electron cloud effect has been observed and measured with dedicated probes. We find good agreement between simulations and measurements for reasonable values of certain secondary electron yield (SEY) parameters, most of which were extracted from recent bench measurements at SLAC

Characteristic and non-characteristic X-ray yields produced from thick Ti element by sub-relativistic electrons

International Nuclear Information System (INIS)

Yadav, Namita; Kumar, Sunil; Bhatt, Pragya; Singh, Raj; Singh, B.K.; Shanker, R.

2012-01-01

Highlights: ► The X-ray spectra of a thick Ti element by 10–25 keV electron impact are obtained. ► Measured Ti K α yields are found to be in good agreement with PWBA theory. ► Doubly differential bremsstrahlung yields agree reasonably with MC simulation. ► Average value of the ratio K α /(K α + K β ) of Ti is found to be 0.881 ± 0.003. -- Abstract: Measurements are performed to study the electron impact energy dependence of doubly differential bremsstrahlung yields (DDBY) and of characteristic Ti K α line yields produced from sub-relativistic electrons (10–25 keV) colliding with a thick Ti (Z = 22) target. The emitted radiation is detected by a Si-PIN photo-diode detector with energy resolution (FWHM) of 180 eV at 5.9 keV. The measured data of DDBY are compared with the results predicted by Monte-Carlo (MC) simulations using the general purpose PENELOPE code. A reasonable agreement is found between experimental and simulation results within the experimental uncertainty of measurements of 12%. Characteristic Ti K α yields are obtained for the considered impact energy range and they are compared with the existing theoretical results. A good agreement is found between the present measurements and the theoretical calculations. Furthermore, data are presented for impact energy dependence of the ratio K α /(K α + K β ) of a thick Ti target under impact of 10–25 keV electrons. The ratio shows a very weak dependence on impact energy in the studied range. The average value of the ratio is found to be 0.881 ± 0.003.

Characteristics of a wire ion plasma source and a secondary emission electron gun

International Nuclear Information System (INIS)

Hotta, Eiki; Osawa, Teruya; Urai, Hajime; Suzuki, Mitsuaki; Yasui, Hiroyuki; Tamagawa, Tohru

1993-01-01

Electrical characteristics of a wire ion plasma source (WIPS) and a secondary emission electron gun, for which the WIPS is used as an ion source, will be reported. The WIPS is a cold-cathode gaseous discharge device, in which a radial electron trapping permits an extremely low pressure gaseous discharge with very low applied voltages. The time evolutions of temperature and density of afterglow plasma were measured with a double probe. In the case of P 0 = 25 mTorr He and the maximum discharge current of 200 A, the temperature and density of electron were about 20 eV and of the order of 10 18 m -3 , respectively, just after the distinction of discharge. The ion current density measured by a biased ion collector (BIC) on the discharge tube wall was found to reach up to 300 mA/cm 2 . A secondary emission electron gun was set on the discharge tube wall opposite to the BIC. An earthed mesh net is installed at a height of 8 mm just in front of the cathode. The maximum negative bias voltage applied to the cathode is limited to -50 kV by the local breakdown in the gun, which occurred synchronously with the WIPS discharge. The electron beam current was measured by the BIC, in which an aluminum foil with a width of 2 μm was placed on instead of the earthed mesh net. At the cathode voltage of -30 kV, the measured beam current density was 220 mA/cm 2 . The extraporation of the resulted curve indicates that if the cathode voltage is -100 kV, the current density will reach to 1 A/cm 2 . The energy spectrum of the electron beam was measured with a magnetic energy analyzer, which was set in place of the BIC. The energy spread is about 300 eV at the central energy of 40 keV. Thus, they demonstrated the possibility of a high current density secondary emission electron gun, for which a WIPS is used as an ion source

Bistable intrinsic charge fluctuations of a dust grain subject to secondary electron emission in a plasma.

Science.gov (United States)

Shotorban, B

2015-10-01

A master equation was formulated to study intrinsic charge fluctuations of a grain in a plasma as ions and primary electrons are attached to the grain through collisional collection, and secondary electrons are emitted from the grain. Two different plasmas with Maxwellian and non-Maxwellian distributions were considered. The fluctuations could be bistable in either plasma when the secondary electron emission is present, as two stable macrostates, associated with two stable roots of the charge net current, may exist. Metastablity of fluctuations, manifested by the passage of the grain charge between two macrostates, was shown to be possible.

Measurements and Studies of Secondary Electron Emission of Diamond Amplified Photocathode

Energy Technology Data Exchange (ETDEWEB)

Wu,Q.

2008-10-01

The Diamond Amplified Photocathode (DAP) is a novel approach to generating electrons. By following the primary electron beam, which is generated by traditional electron sources, with an amplifier, the electron beam available to the eventual application is increased by 1 to 2 orders of magnitude in current. Diamond has a very wide band gap of 5.47eV which allows for a good negative electron affinity with simple hydrogenation, diamond can hold more than 2000MV/m field before breakdown. Diamond also provides the best rigidity among all materials. These two characters offer the capability of applying high voltage across very thin diamond film to achieve high SEY and desired emission phase. The diamond amplifier also is capable of handling a large heat load by conduction and sub-nanosecond pulse input. The preparation of the diamond amplifier includes thinning and polishing, cleaning with acid etching, metallization, and hydrogenation. The best mechanical polishing available can provide high purity single crystal diamond films with no less than 100 {micro}m thickness and <15 nm Ra surface roughness. The ideal thickness for 700MHz beam is {approx}30 {micro}m, which requires further thinning with RIE or laser ablation. RIE can achieve atomic layer removal precision and roughness eventually, but the time consumption for this procedure is very significant. Laser ablation proved that with <266nm ps laser beam, the ablation process on the diamond can easily achieve removing a few microns per hour from the surface and <100nm roughness. For amplifier application, laser ablation is an adequate and efficient process to make ultra thin diamond wafers following mechanical polishing. Hydrogenation will terminate the diamond surface with monolayer of hydrogen, and form NEA so that secondary electrons in the conduction band can escape into the vacuum. The method is using hydrogen cracker to strike hydrogen atoms onto the bare diamond surface to form H-C bonds. Two independent

Ultrahigh resolution focused electron beam induced processing: the effect of substrate thickness

DEFF Research Database (Denmark)

van Dorp, Willem F; Lazic, Ivan; Beyer, André

2011-01-01

It is often suggested that the growth in focused electron beam induced processing (FEBIP) is caused not only by primary electrons, but also (and even predominantly) by secondary electrons (SEs). If that is true, the growth rate for FEBIP can be changed by modifying the SE yield. Results from our ...

Reduction in clover-grass yield caused by different traffic intensities

DEFF Research Database (Denmark)

Green, Ole; Jørgensen, Rasmus Nyholm; Kristensen, Kristian

Different traffic intensities have been shown to have a negative influence on the yield of grass and clover. A full scale grass-clover field trial was established to estimate the effect on clover-grass yields as a function of different wheel loads and tire pressures. The trial comprised 16...... close to the north, south and east border of the field. No significant interactions were found between the timing of crop and soil damage as affected by wheel load and tire pressure. However, at specific times, there was a significant effect of wheel load and secondary by the tire pressure. At all...... measurement times, the yield was lower using a wheel load of 4745 kg than for a wheel load of 2865 kg.     Key words (for Electronic Reference Library) Traffic intensities, tire load/pressure, clover/grass, yield loss, ...

Secondary emission yield at low-primary energies of magnetic materials for anti-multipactor applications

CERN Document Server

Aguilera, L; Olano, L; Casas, A; Morales, P; Vázquez, M; Galán, L; Caspers, F; Costa-Pinto, P; Taborelli, M; Raboso, D

2014-01-01

Secondary electron emission processes under electron bombardment are central to many effects at surfaces and interfaces, and to many in vacuum high power RF electronic devices where multipactor can be very intense [1,2]. Ferrite materials are usually used in microwave components used in space telecommunication systems, as circulators, phase-shifters, switches, and isolators. The physics of the multipactor phenomenon existing in microwave devices based on ferrite materials is an important issue and it is urgent to be researched [3]. One difficulty in the analysis of the multipactor effect in RF components containing ferrite lies on the fact that this material is an anysotropic magnetic medium controlled by an applied permanent magnetic field, which is used to magnetize the ferrite material. SEY and other properties (structure, magnetic behaviour,...) of soft-magnetic materials were studied in this work. MnZn soft ferrites magnets are suitable in the situation of frequency < 3MHz, low loss and high μi. Comp...

Control of secondary electrons from ion beam impact using a positive potential electrode

Energy Technology Data Exchange (ETDEWEB)

Crowley, T. P., E-mail: tpcrowley@xanthotechnologies.com; Demers, D. R.; Fimognari, P. J. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

Can Low Energy Electrons Affect High Energy Physics Accelerators?

International Nuclear Information System (INIS)

Cimino, Roberto

2004-01-01

The properties of the electrons participating in the build up of an electron cloud (EC) inside the beam-pipe have become an increasingly important issue for present and future accelerators whose performance may be limited by this effect. The EC formation and evolution are determined by the wall-surface properties of the accelerator vacuum chamber. Thus, the accurate modeling of these surface properties is an indispensible input to simulation codes aimed at the correct prediction of build-up thresholds, electron-induced instability or EC heat load. In this letter, we present the results of surface measurements performed on a prototype of the beam screen adopted for the Large Hadron Collider (LHC), which presently is under construction at CERN. We have measured the total secondary electron yield (SEY) as well as the related energy distribution curves (EDC) of the secondary electrons as a function of incident electron energy. Attention has been paid, for the first time in this context, to the probability at which low-energy electrons (<∼ 20 eV) impacting on the wall create secondaries or are elastically reflected. It is shown that the ratio of reflected to true-secondary electrons increases for decreasing energy and that the SEY approaches unity in the limit of zero primary electron energy

Measurements of the Secondary Electron Emission from Rare Gases at 4.2K

CERN Document Server

Bozhko, Y.; Hilleret, N.

2013-01-01

Dependence of the secondary electron yield (SEY) from the primary beam incident energy and the coverage has been measured for neon, argon, krypton and xenon condensed on a target at 4.2K. The beam energy ranged between 100 eV and 3 keV, the maximal applied coverage have made up 12000, 4700, 2500 and 1400 monolayers correspondingly for neon, argon, krypton and xenon. The SEY results for these coverages can be considered as belonging only to investigated gases without influence of the target material. The SEY dependencies versus the primary beam energy for all gases comprise only an ascending part and therefore, the maximal measured SEY values have been obtained for the beam energy of 3keV and have made up 62, 73, 60.5 and 52 for neon, argon, krypton and xenon correspondingly. Values of the first cross-over have made up 21 eV for neon, 14 eV for argon, 12.5 eV for krypton and 10.5 eV for xenon. An internal field appearing across a film due to the beam impact can considerably affect the SEY measurements that dem...

Ionization of liquid argon by x-rays: effect of density on electron thermalization and free ion yields

International Nuclear Information System (INIS)

Huang, S.S.-S.; Gee, N.; Freeman, G.R.

1991-01-01

Free ion yields were measured in liquid argon as a function of electric field strength at densities 736-1343 kg/m 3 (temperatures 149-95 K). The field dependence of the yields was parametrized using the extended Onsager and box models. Over the present density range the total ion yield was constant within 1% and was taken as 4.4, the average of earlier values at 87-91 K. The absence of internal vibrational modes in argon makes its electron thermalizing ability smaller than that of methane. The electron thermalization distance b GP in liquid argon is 3-5 times longer than that in liquid methane at a given d/d c (d c = critical fluid density). (author)

3 to 15 keV Ar+ induced Auger electron emission from Si and Ar

International Nuclear Information System (INIS)

Kempf, J.; Kaus, G.

1977-01-01

Ar + induced Auger electrons from Si and Ar were investigated at bombardment energies between 3-15 keV and target currents of a few μA. The Auger electron yields were compared with secondary ion yields of Si and Ar by simultaneous SIMS-AES measurements. In the ion induced Auger spectra of Si five Auger peaks and in the Ar spectra three Auger peaks were observed. The ion induced Auger electron yield of Si and Ar were found to be strongly dependent upon the primary ion energy. 'Bulk like' and 'atomic like' Auger transitions of ion induced Auger electrons of Si were observed. (orig.) [de

Measurements of L shell X-ray yields of thick Ag target by 6–29 keV electron impact

International Nuclear Information System (INIS)

Zhao, J.L.; Tian, L.X.; Li, X.L.; An, Z.; Zhu, J.J.; Liu, M.T.

2015-01-01

In this paper, the L shell X-ray yields for a thick Ag target have been measured at incident electron energies of 6–29 keV. The experimental values are compared with the Monte Carlo simulation results that are obtained by using the PENELOPE code, in which the inner-shell ionization cross sections by electron impact calculated in the theoretical frame of distorted wave Born approximation are used. The experimental and simulation values are in agreement with ∼10% difference. Meanwhile, the L shell X-ray production cross sections are also obtained based on the measured L shell X-ray yields for a thick Ag target in this paper, and are compared with other experimental Ag L shell X-ray production cross section data by electron and positron impact measured previously and some theoretical models. Some factors that could affect these comparisons are also discussed in this paper. - Highlights: • We measured L shell X-ray yields of thick Ag target by 6–29 keV electrons. • Our measured X-ray yields are in good agreement with the MC results with ∼10%. • L shell production cross sections are obtained based on the measured X-ray yields. • L shell production cross sections obtained are in good agreement with theories

Super TOF secondary ion mass spectroscopy using very highly charged primary ions up to Th70+

International Nuclear Information System (INIS)

Briere, M.A.; Schenkel, T.; Schneider, D.

1995-01-01

The LLNL Electron Beam Ion Trap (EBIT) has made low emittance beams of slow highly charged ions available for ion-solid interaction studies. Such interactions feature the dominance of electronic over collisional effects, and the shock waves generated by the ionized target atoms can desorb large numbers of large molecular species from the surface. This paper presents the first systematic study of the sputtering process due to the incidence of slow very highly charged ions; Th 70+ ions are extracted from EBIT at 7 keV * q and directed onto thin SiO 2 films on Si. Results suggest secondary ion yields of up to 25 per incident ion for Th 70+ (secondary ion yield is increased over that for singly or moderately charged ions). Correlations of the negative, positive, and negative cluster ion yields show promise for application of highly charged ion induced sputtering for enhanced sensitivity and quantitative (absolute) SIMS analysis of deep submicron scale surface layers and polymeric and biomolecular material analysis

Enhanced flashover strength in polyethylene nanodielectrics by secondary electron emission modification

Directory of Open Access Journals (Sweden)

Weiwang Wang

2016-04-01

Full Text Available This work studies the correlation between secondary electron emission (SEE characteristics and impulse surface flashover in polyethylene nanodielectrics both theoretically and experimentally, and illustrates the enhancement of flashover voltage in low-density polyethylene (LDPE through incorporating Al2O3 nanoparticles. SEE characteristics play key roles in surface charging and gas desorption during surface flashover. This work demonstrates that the presence of Al2O3 nanoparticles decreases the SEE coefficient of LDPE and enhances the impact energy at the equilibrium state of surface charging. These changes can be explained by the increase of surface roughness and of surface ionization energy, and the strong interaction between nanoparticles and the polymer dielectric matrix. The surface charge and flashover voltage are calculated according to the secondary electron emission avalanche (SEEA model, which reveals that the positive surface charges are reduced near the cathode triple point, while the presence of more nanoparticles in high loading samples enhances the gas desorption. Consequently, the surface flashover performance of LDPE/Al2O3 nanodielectrics is improved.

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Top layer's thickness dependence on total electron-yield X-ray standing-wave

International Nuclear Information System (INIS)

Ejima, Takeo; Yamazaki, Atsushi; Banse, Takanori; Hatano, Tadashi

2005-01-01

A Mo single-layer film with a stepwise thickness distribution was fabricated on the same Mo/Si reflection multilayer film. Total electron-yield X-ray standing-wave (TEY-XSW) spectra of the aperiodic multilayer were measured with reflection spectra. The peak positions of the standing waves in the TEY-XSW spectra changed as the film thickness of the top Mo-layer increased

Breakdown of a Space Charge Limited Regime of a Sheath in a Weakly Collisional Plasma Bounded by Walls with Secondary Electron Emission

International Nuclear Information System (INIS)

Sydorenko, D.; Smolyakov, A.; Kaganovich, I.; Raitses, Y.

2009-01-01

A new regime of plasma-wall interaction is identified in particle-in-cell simulations of a hot plasma bounded by walls with secondary electron emission. Such a plasma has a strongly non-Maxwellian electron velocity distribution function and consists of bulk plasma electrons and beams of secondary electrons. In the new regime, the plasma sheath is not in a steady space charge limited state even though the secondary electron emission produced by the plasma bulk electrons is so intense that the corresponding partial emission coefficient exceeds unity. Instead, the plasma-sheath system performs relaxation oscillations by switching quasiperiodically between the space charge limited and non-space-charge limited states.

Surface potential measurement of insulators in negative-ion implantation by secondary electron energy-peak shift

International Nuclear Information System (INIS)

Nagumo, Shoji; Toyota, Yoshitaka; Tsuji, Hiroshi; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1993-01-01

Negative-ion implantation is expected to realize charge-up free implantation. In this article, about a way to specify surface potential of negative-ion implanted insulator by secondary-electron-energy distribution, its principle and preliminary experimental results are described. By a measuring system with retarding field type energy analyzer, energy distribution of secondary electron from insulator of Fused Quartz in negative-carbon-ion implantation was measured. As a result the peak-shift of its energy distribution resulted according with the surface potential of insulator. It was found that surface potential of insulator is negatively charged by only several volts. Thus, negative-ion implanted insulator reduced its surface charge-up potential (without any electron supply). Therefore negative-ion implantation is considered to be much more effective method than conventional positive-ion implantation. (author)

Revealing by secondary electronic emission of internal electric fields in the yttriated zirconia, irradiated by electrons of 1 MeV

International Nuclear Information System (INIS)

Blaise, G.; Paris-11 Univ., 91 - Orsay

2007-01-01

The defects due to irradiation in a dielectric material present an activity which can generate macroscopic internal electric fields. A method of investigation of these fields, based on the measure of the Secondary Electronic Emission coefficient, has been developed on a scanning electric microscope. This ones contains two low noise detectors which respectively measure the influence current I IC produced by the charges trapping in the material and the current I SB due to secondary and backscattered electrons which come from the sample. The Secondary Emission coefficient is given by σ=I SB /(I SB +I IC ). The charges trapping during an electrons injection leads to a variation of σ for its intrinsic value σ 0 relative to the uncharged material, until the stationary value σ st =1 corresponding to the auto-regulated condition. This variation is due to the development of an internal electric field produced by the accumulation of the charges trapped during injection. In comparing the evolutions of σ of a fresh yttriated zirconia and of an yttriated zirconia irradiated by electrons of 1 MeV with a dose rate of 10 18 e/cm 2 , it has been revealed that an internal field (due to irradiation) of about 0.5*10 6 V/m exists at a depth of the micron order. This field, directed towards the outside of the material surface, is attributed to the F + defects and to the T centers produced by the impact of the electrons of 1 MeV. In carrying out annealings until 1000 K, a progressive disappearance of this field is observed in the temperature range of 400-600 K, directly due to the F + defects and T centers recovery, as it has been observed by ESR. An internal field three times weaker than the preceding ones has been revealed at a few nm under the surface. Its disappearance from a temperature of 1000 K suggests that it is due to the redistribution of the chemical species into the surface, during the irradiation with electrons of 1 MeV. (O.M.)

Investigation of secondary hardening in Co–35Ni–20Cr–10Mo alloy using analytical scanning transmission electron microscopy

International Nuclear Information System (INIS)

Sorensen, D.; Li, B.Q.; Gerberich, W.W.; Mkhoyan, K.A.

2014-01-01

The mechanism of secondary hardening in MP35N (Co–35Ni–20Cr–10Mo) alloy due to exposures at elevated temperatures has been studied. It was observed that short exposure to elevated temperatures increased the ultimate tensile strength and yield stress while decreasing the elongation of MP35N wires. Upon aging at temperatures from 300 to 900 °C the elastic modulus increased although no changes in crystallographic orientation or microstructure were observed. The grain size and major texture components were unchanged following aging. Analytical scanning transmission electron microscope investigation showed that MP35N is hardened by preferential segregation of molybdenum to stacking faults and deformation twins. It also revealed that the concentration of molybdenum segregation was proportional to the amount of initial cold work before aging

New secondary batteries utilizing electronically conductive polymer cathodes

Science.gov (United States)

Martin, Charles R.; White, Ralph E.

1989-01-01

The objectives of this project are to characterize the transport properties in electronically conductive polymers and to assess the utility of these films as cathodes in lithium/polymer secondary batteries. During this research period, progress has been made in a literature survey of the historical background, methods of preparation, the physical and chemical properties, and potential technological applications of polythiophene. Progress has also been made in the characterization of polypyrrole flat films and fibrillar films. Cyclic voltammetry and potential step chronocoulometry were used to gain information on peak currents and potentials switching reaction rates, charge capacity, and charge retention. Battery charge/discharge studies were also performed.

The Dose Rate Dependence of the Yield of Trapped Electrons in Crystalline Ice

DEFF Research Database (Denmark)

Nilsson, Johan Daniel Göran; Pagsberg, Palle Bjørn

1980-01-01

in competition with other reactions and we propose a simple model where we assume that the mobile electrons can undergo bimolecular bulk reactions with protons and OH radicals. Rate constants of 3.0 × 1015 M−1 S−1 and 1.4 × 1014 M−1 S−1 for the two reactions were required in the model in order to account......The yield of localized excess electrons in crystalline H2O ice has been studied as a function of the dose rate at various temperatures in the range −10 to −40°C. The G value was found to decrease significantly with increasing dose rate. Thus it appears that the localization of electrons takes place...

Nitrate radical oxidation of γ-terpinene: hydroxy nitrate, total organic nitrate, and secondary organic aerosol yields

Science.gov (United States)

Slade, Jonathan H.; de Perre, Chloé; Lee, Linda; Shepson, Paul B.

2017-07-01

Polyolefinic monoterpenes represent a potentially important but understudied source of organic nitrates (ONs) and secondary organic aerosol (SOA) following oxidation due to their high reactivity and propensity for multi-stage chemistry. Recent modeling work suggests that the oxidation of polyolefinic γ-terpinene can be the dominant source of nighttime ON in a mixed forest environment. However, the ON yields, aerosol partitioning behavior, and SOA yields from γ-terpinene oxidation by the nitrate radical (NO3), an important nighttime oxidant, have not been determined experimentally. In this work, we present a comprehensive experimental investigation of the total (gas + particle) ON, hydroxy nitrate, and SOA yields following γ-terpinene oxidation by NO3. Under dry conditions, the hydroxy nitrate yield = 4(+1/-3) %, total ON yield = 14(+3/-2) %, and SOA yield ≤ 10 % under atmospherically relevant particle mass loadings, similar to those for α-pinene + NO3. Using a chemical box model, we show that the measured concentrations of NO2 and γ-terpinene hydroxy nitrates can be reliably simulated from α-pinene + NO3 chemistry. This suggests that NO3 addition to either of the two internal double bonds of γ-terpinene primarily decomposes forming a relatively volatile keto-aldehyde, reconciling the small SOA yield observed here and for other internal olefinic terpenes. Based on aerosol partitioning analysis and identification of speciated particle-phase ON applying high-resolution liquid chromatography-mass spectrometry, we estimate that a significant fraction of the particle-phase ON has the hydroxy nitrate moiety. This work greatly contributes to our understanding of ON and SOA formation from polyolefin monoterpene oxidation, which could be important in the northern continental US and the Midwest, where polyolefinic monoterpene emissions are greatest.

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Secondary emission ion analyzer provided with an electron gun for insulating material analysis

International Nuclear Information System (INIS)

Blanchard, Bruno; Carrier, Patrick; Marguerite, J.-L.; Rocco, J.-C.

1976-01-01

This invention relates to a secondary emission ion analyser, fitted with an electron gun. It is used in the mass spectrometry analysis of electrically insulating bodies. It has already been suggested to bombard the target with an electron beam in conjunction with the beam of primary particles, in order to reduce the space charge near the target. The object of this invention is the application of this known process to appliances of the ion analyser type with a high electric field near the target. Its main characteristic is the use of an electron gun emitting an electron beam through the extraction lens placed opposite the target. The extraction electric field influences the path of the electrons but the electric and mechanical specifications of the electron gun in the invention are such that the target is correctly sprayed by the electron beam [fr

Yield improvement strategies for the production of secondary metabolites in plant tissue culture: silymarin from Silybum marianum tissue culture.

Science.gov (United States)

AbouZid, S

2014-01-01

Plant cell culture can be a potential source for the production of important secondary metabolites. This technology bears many advantages over conventional agricultural methods. The main problem to arrive at a cost-effective process is the low productivity. This is mainly due to lack of differentiation in the cultured cells. Many approaches have been used to maximise the yield of secondary metabolites produced by cultured plant cells. Among these approaches: choosing a plant with a high biosynthetic capacity, obtaining efficient cell line for growth and production of metabolite of interest, manipulating culture conditions, elicitation, metabolic engineering and organ culture. This article gives an overview of the various approaches used to maximise the production of pharmaceutically important secondary metabolites in plant cell cultures. Examples of using these different approaches are shown for the production of silymarin from Silybum marianum tissue culture.

Secondary electron emission from a thin carbon foil induced by H+, He2+ and Li3+ at fixed velocity of 1 MeV/u

International Nuclear Information System (INIS)

Ogawa, H.; Sorai, K.; Amano, S.; Ishii, K.; Kaneko, T.

2013-01-01

The statistical distributions of the number of forward- and backward-emitted secondary electrons (SE’s) from a thin carbon foil have been measured simultaneously in coincidence with foil-transmitted H + , He 2+ and Li 3+ ions of 1 MeV/u in order to examine the forward–backward correlation of the SE emission (refer to as ‘FB correlation’ hereafter). With these projectiles, we have also measured the energy spectrum of SEs emitted from another carbon foil of similar thickness in the direction around 0° with respect to the incident beams. From the emission statistics data, it is found that both of the inclusive forward and backward SE yields divided by the square of the projectile atomic number (Z p ) decrease with increasing Z p . This trend is qualitatively consistent with previous works by other authors. On the other hand, it has been certified from the energy spectra that the yields of binary electron scale well with Z p 2 . As for the FB correlation, the forward- or backward-emitted SE yield decreases gradually with increasing the number of SEs emitted in the opposite directions. This so-called ‘negative FB correlation’ appears to be pronounced for He 2+ and Li 3+ ions compared with that for H + ions. Since low energy internal SEs do not contribute to the FB correlation, the observed Z p -dependent FB correlation seems to be consistent with the well Z p 2 -scaled production of high energy internal SEs and the decrease of the inclusive forward and backward SE yields with respect to this scaling

Surface potential measurement of negative-ion-implanted insulators by analysing secondary electron energy distribution

International Nuclear Information System (INIS)

Toyota, Yoshitaka; Tsuji, Hiroshi; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki.

1994-01-01

The negative ion implantation method we have proposed is a noble technique which can reduce surface charging of isolated electrodes by a large margin. In this paper, the way to specify the surface potential of negative-ion-implanted insulators by the secondary electron energy analysis is described. The secondary electron energy distribution is obtained by a retarding field type energy analyzer. The result shows that the surface potential of fused quartz by negative-ion implantation (C - with the energy of 10 keV to 40 keV) is negatively charged by only several volts. This surface potential is extremely low compared with that by positive-ion implantation. Therefore, the negative-ion implantation is a very effective method for charge-up free implantation without charge compensation. (author)

A study of Al/Si interface by photoemission, Auger electron yield and Auger electron spectroscopies

International Nuclear Information System (INIS)

Kobayashi, K.L.I.; Barth, J.; Gerken, F.; Kunz, C.; Deutsches Elektronen-Synchrotron

1980-06-01

Photoemission, Auger electron yield and Auger electron spectra were observed for Al/Si(111) interfaces with various Al coverage prepared by successive deposition using a molecular beam source. The Al 3p derived states are introduced at around the top of the valence band by the Al coverage of less than one monolayer. The Al surface layer behaves as a 'metal' and the Fermi level is stabilized in the Al 3p derived states at about 0.3 eV above the top of the valence band of Si. The Schottky barrier height in this stage is about 0.8 eV and further increase in Al coverage does not change the barrier height. A covalent bonding model of the Al/Si interface based on the experimental results is proposed. The present result favors the on-top geometry of Al atoms on Si(111) surface among the geometries used in the pseudopotential calculation by Zhang and Schlueter. (orig.)

Design of an electronic charged particle spectrometer to measure (ρR), yield, and implosion symmetry on the OMEGA Upgrade

International Nuclear Information System (INIS)

Hicks, D.G.; Li, C.K.; Petrasso, R.D.; Wenzel, K.W.; Knauer, J.P.

1994-11-01

The preliminary design for a state-of-the-art diagnostic that will measure a broad energy spectrum of charged particles generated in the OMEGA Upgrade facility is investigated. Using a set of photodiodes (∼10) and a 0.8 Tesla permanent magnet, the diagnostic will uniquely determine particle energies and identities from 0.2 MeV up to the maximum charged particle energies (10.6 MeV tritons, 12.5 MeV deuterons and 17.4 MeV protons). With its high density picture elements, each photodiode has 10 6 single-hit detectors, giving the spectrometer a dynamic range of 1 - 10 5 particles/shot. For example, in the case of a DT yield of 10 9 neutrons, about 100 knock-on charged particles will be detected when the spectrometer aperture is 60 cm from the implosion. Furthermore, the measurement of knock-on D and T spectra will allow ρR's up to 0.15 g/cm 2 to be measured (for a 1 keV plasma), or 0.3 g/cm 2 2 if hydrogen doping is used. In addition, the yield and slowing down of secondary protons may be used to determine ρR up to 0.3 g/cm 2 . Significantly, this diagnostic will also directly measure the DD fusion yield and energy degradation of nascent 3 MeV protons. By using two such compact spectrometers to measure the yield and spectra on widely separated ports around the OMEGA Upgrade target chamber, the implosion and bum symmetry can be determined. Furthermore, the ion temperature, and, in principle, even the electron temperature can be measured. The diagnostic and its development will be fully tested at several critical steps, utilizing 0.2-16 MeV protons (and several other charged particles and neutrons) from our absolutely calibrated Cockcroft-Walton facility

Multi-channel electronics for secondary emission grid profile monitor of TTF linac

International Nuclear Information System (INIS)

Reingardt-Nikoulin, P.; Gaidash, V.; Mirzojan, A.; Kocharyan, V.; Noelle, D.

2004-01-01

According to the TTF beam experimental program, a measurement f the time dependence of the energy spread within the bunch train should be done by means of a standard device for profile measurements, that is Secondary Emission Grid (SEMG). SEMG on the high-energy TTF beam is placed in the focal plane of the magnet spectrometer. It should measure the total energy spread in the range from 0.1% up to a few percents for any single or any group of electron bunches in the bunch train of TTF Linac. SEMG profile measurements with new high sensitive electronics are described. Beam results of SEMG Monitor test are given for two modifications of an electronic preamplifier

Electrons scattered inside small dust grains of various materials

International Nuclear Information System (INIS)

Richterova, Ivana; Beranek, Martin; Pavlu, Jiri; Nemecek, Zdenek; Safrankova, Jana

2010-01-01

The dust grain charge in an electron beam is given by a difference in numbers of electrons that fall onto the grain and those leaving it. Electrons with energies exceeding 1 keV can penetrate through submicron-sized dust grains. If the grain is small enough, a yield of these electrons reaches unity but they leave a part of their energy inside the grain and this energy excites secondary electrons. The paper presents a hybrid Monte Carlo code that simulates paths of the primary electrons inside a spherical grain and provides the yield of scattered electrons and their energy spectrum as a function of the grain size and material. This code is based on the Richterovaet al. [Phys. Rev. B 74, 235430 (2006)] model but it includes several corrections important for light materials like carbon or ice. The model was verified using experimental results obtained on large planar samples. For spherical samples, we have found that the yield of scattered electrons reaches unity for 50 nm Au grains illuminated by 5 keV electrons, whereas the same effect can be observed on ≅1000 nm carbon grains.

Total yield of channeling radiation from relativistic electrons in thin Si and W crystals

International Nuclear Information System (INIS)

Abdrashitov, S.V.; Bogdanov, O.V.; Dabagov, S.B.; Pivovarov, Yu.L.; Tukhfatullin, T.A.

2013-01-01

Orientation dependences of channeling radiation total yield from relativistic 155–855 MeV electrons at both 〈1 0 0〉 axial and (1 0 0) planar channeling in thin silicon and tungsten crystals are studied by means of computer simulations. The model as well as computer code developed allows getting the quantitative results for orientation dependence of channeling radiation that can be used for crystal alignment in channeling experiments and/or for diagnostics of initial angular divergence of electron beam

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Cumpson, Peter J.; Portoles, Jose F.; Barlow, Anders J.; Sano, Naoko [National EPSRC XPS User' s Service (NEXUS), School of Mechanical and Systems Engineering, Newcastle University, Newcastle upon Tyne, NE1 7RU (United Kingdom)

2013-09-28

Argon Gas Cluster-Ion Beam sources are likely to become widely used on x-ray photoelectron spectroscopy and secondary ion mass spectrometry instruments in the next few years. At typical energies used for sputter depth profiling the average argon atom in the cluster has a kinetic energy comparable with the sputter threshold, meaning that for the first time in practical surface analysis a quantitative model of sputter yields near threshold is needed. We develop a simple equation based on a very simple model. Though greatly simplified it is likely to have realistic limiting behaviour and can be made useful for estimating sputter yields by fitting its three parameters to experimental data. We measure argon cluster-ion sputter yield using a quartz crystal microbalance close to the sputter threshold, for silicon dioxide, poly(methyl methacrylate), and polystyrene and (along with data for gold from the existing literature) perform least-squares fits of our new sputter yield equation to this data. The equation performs well, with smaller residuals than for earlier empirical models, but more importantly it is very easy to use in the design and quantification of sputter depth-profiling experiments.

Secondary electrons detectors for beam tracking: micromegas and wire chamber

International Nuclear Information System (INIS)

Pancin, J; Chaminade, T; Drouart, A; Kebbiri, M; Riallot, M; Fernandez, B; Naqvi, F

2009-01-01

SPIRAL2 or FAIR will be able to deliver beams of radioactive isotopes of low energy (less than 10 MeV/n). The emittance of these new beams will impose the use of beam tracking detectors to reconstruct the exact impact position of the nuclei on the experimental target. However, due to their thickness, the classical detectors will generate a lot of energy and angular straggling. A possible alternative is the SED principle (Secondary Electron Detector). It consists of an emissive foil placed in beam and a detector for the secondary electrons ejected by the passing of the nuclei through the foil. An R and D program has been initiated at CEA Saclay to study the possibility to use low pressure gaseous detectors as SED for beam tracking. Some SED have been already used on the VAMOS spectrometer at GANIL since 2004. We have constructed new detectors on this model to measure their performances in time and spatial resolution, and counting rate. Other detector types are also under study. For the first time, a test with different micromegas detectors at 4 Torr has been realized. A comparison on the time resolution has been performed between wire chamber and micromegas at very low pressure. The use of micromegas could be promising to improve the counting rate capability and the robustness of beam tracking detectors.

Significance of fundamental processes of radiation chemistry in hot atom chemical processes: electron thermalization

International Nuclear Information System (INIS)

Nishikawa, M.

1984-01-01

The author briefly reviews the current understanding of the course of electron thermalization. An outline is given of the physical picture without going into mathematical details. The analogy of electron thermalization with hot atom processes is taken as guiding principle in this paper. Content: secondary electrons (generation, track structure, yields); thermalization (mechanism, time, spatial distribution); behaviour of hot electrons. (Auth.)

Excitation-emission spectra and fluorescence quantum yields for fresh and aged biogenic secondary organic aerosols

Energy Technology Data Exchange (ETDEWEB)

Lee, Hyun Ji; Laskin, Alexander; Laskin, Julia; Nizkorodov, Sergey A.

2013-05-10

Certain biogenic secondary organic aerosols (SOA) become absorbent and fluorescent when exposed to reduced nitrogen compounds such as ammonia, amines and their salts. Fluorescent SOA may potentially be mistaken for biological particles by detection methods relying on fluorescence. This work quantifies the spectral distribution and effective quantum yields of fluorescence of SOA generated from two monoterpenes, limonene and a-pinene, and two different oxidants, ozone (O3) and hydroxyl radical (OH). The SOA was generated in a smog chamber, collected on substrates, and aged by exposure to ~100 ppb ammonia vapor in air saturated with water vapor. Absorption and excitation-emission matrix (EEM) spectra of aqueous extracts of aged and control SOA samples were measured, and the effective absorption coefficients and fluorescence quantum yields (~0.005 for 349 nm excitation) were determined from the data. The strongest fluorescence for the limonene-derived SOA was observed for excitation = 420+- 50 nm and emission = 475 +- 38 nm. The window of the strongest fluorescence shifted to excitation = 320 +- 25 nm and emission = 425 +- 38 nm for the a-pinene-derived SOA. Both regions overlap with the excitation-emission matrix (EEM) spectra of some of the fluorophores found in primary biological aerosols. Our study suggests that, despite the low quantum yield, the aged SOA particles should have sufficient fluorescence intensities to interfere with the fluorescence detection of common bioaerosols.

Electron Stimulated Desorption of Condensed Gases on Cryogenic Surfaces

CERN Document Server

Tratnik, H; Hilleret, Noël

2005-01-01

In ultra-high vacuum systems outgassing from vacuum chamber walls and desorption from surface adsorbates are usually the factors which in°uence pressure and residual gas composition. In particular in beam vacuum systems of accelerators like the LHC, where surfaces are exposed to intense synchro- tron radiation and bombardment by energetic ions and electrons, properties like the molecular desorption yield or secondary electron yield can strongly in°uence the performance of the accelerator. In high-energy particle accelerators operating at liquid helium temperature, cold surfaces are exposed to the bombardment of energetic photons, electrons and ions. The gases released by the subsequent desorption are re-condensed on the cold surfaces and can be re-desorbed by the impinging electrons and ions. The equilibrium coverage reached on the surfaces exposed to the impact of energetic particles depends on the desorption yield of the condensed gases and can a®ect the operation of the accelerator by modifying th...

Quantum molecular dynamics study on energy transfer to the secondary electron in surface collision process of an ion

International Nuclear Information System (INIS)

Shibahara, M; Satake, S; Taniguchi, J

2008-01-01

In the present study the quantum molecular dynamics method was applied to an energy transfer problem to an electron during ionic surface collision process in order to elucidate how energy of ionic collision transfers to the emitted electrons. Effects of various physical parameters, such as the collision velocity and interaction strength between the observed electron and the classical particles on the energy transfer to the electron were investigated by the quantum molecular dynamics method when the potassium ion was collided with the surface so as to elucidate the energy path to the electron and the predominant factor of energy transfer to the electron. Effects of potential energy between the ion and the electron and that between the surface molecule and the electron on the electronic energy transfer were shown in the present paper. The energy transfer to the observed secondary electron through the potential energy term between the ion and the electron was much dependent on the ion collision energy although the energy increase to the observed secondary electron was not monotonous through the potential energy between the ion and surface molecules with the change of the ion collision energy

Models for the transport of low energy electrons in water and the yield of hydrated electrons at early times

International Nuclear Information System (INIS)

Brenner, D.J.; Miller, J.H.; Ritchie, R.H.; Bichsel, H.

1985-01-01

An insulator model with four experimental energy bands was used to fit the optical properties of liquid water and to extend these data to non-zero momentum transfer. Inelastic mean free paths derived from this dielectric response function provided the basic information necessary to degrade high energy electrons to the subexcitation energy domain. Two approaches for the transport of subexcitation electrons were investigated. (i) Gas phase cross sections were used to degrade subexcitation electrons to thermal energy and the thermalization lengths were scaled to unit density. (ii) Thermalization lengths were estimated by age-diffusion theory with a stopping power deduced from the data on liquid water and transport cross sections derived from elastic scattering in water vapor. Theoretical ranges were compared to recent experimental results. A stochastic model was used to calculate the rapid diffusion and reaction of hydrated electrons with other radiolysis products. The sensitivity of the calculated yields to the model assumptions and comparison with experimental data are discussed

Electron temperature determination from the HeI 3889 angstroem and 5016 angstroem line intensities

International Nuclear Information System (INIS)

Brenning, N.

1979-03-01

The possibility of determining electron temperature by helium spectro scopy in low-density (n(sub e) 2 m - ) plasmas is discussed. It is concluded that most lines can only be used at very low densities (n(sub e) 1 m - ) because the line intensities are highly influenced by secondary processes, such as electron impact induced transitions between excited levels or excitations from metastable levels. The density range where measurements are possible can extended if the influence of these secondary processes on the line intensities can be determined. For most helium I lines this is impossible for lack of atomic data. However, there are two exceptions, the 3889 angstroem (3 3 P yields 2 3 S) and the 5016 angstroem (3 1 yields 2 1 S) lines. The influence from secondary processes on these lines is calculated, and methods are developed which can be used for measurement of electron temperatures T(sub e 1 m - . The use of the methods is illustrated by a experiment where they have been successfully applied. (author)

Radiolysis of liquid water: an attempt to reconcile Monte-Carlo calculations with new experimental hydrated electron yield data at early times

International Nuclear Information System (INIS)

Muroya, Y.; Meesungnoen, J.; Jay-Gerin, J.-P.; Filali-Mouhim, A.; Goulet, T.; Katsumura, Y.; Mankhetkorn, S.

2002-01-01

A re-examination of our Monte-Carlo modeling of the radiolysis of liquid water by low linear-energy-transfer (LET ∼ 0.3 keV μm -1 ) radiation is undertaken herein in an attempt to reconcile the results of our simulation code with recently revised experimental hydrated electron (e aq - ) yield data at early times. The thermalization distance of subexcitation electrons, the recombination cross section of the electrons with their water parent cations prior to thermalization, and the branching ratios of the different competing mechanisms in the dissociative decay of vibrationally excited states of water molecules were taken as adjustable parameters in our simulations. Using a global-fit procedure, we have been unable to find a set of values for those parameters to simultaneously reproduce (i) the revised e aq - yield of 4.0 ± 0.2 molecules per 100 eV at 'time zero' (that is, a reduction of ∼20% over the hitherto accepted value of 4.8 molecules per 100 eV), (ii) the newly measured e aq - decay kinetic profile from 100 ps to 10 ns, and (iii) the time-dependent yields of the other radiolytic species H . , . OH, H 2 , and H 2 O 2 (up to ∼1 μs). The lowest possible limiting 'time-zero' yield of e aq - that we could in fact obtain, while ensuring an acceptable agreement between all computed and experimental yields, was ∼4.4 to 4.5 molecules per 100 eV. Under these conditions, the mean values of the electron thermalization distance and of the geminate electron-cation recombination probability, averaged over the subexcitation electron 'entry spectrum,' are found to be equal to ∼139 A and ∼18%, respectively. These values are to be compared with those obtained in our previous simulations of liquid water radiolysis, namely ∼88 A and ∼5.5%, respectively. Our average electron thermalization distance is also to be compared with the typical size (∼64-80 A) of the initial hydrated electron distributions estimated in current deterministic models of 'spur' chemistry

Research on nonlinearity effect of secondary electron multiplier

International Nuclear Information System (INIS)

Wei Xingjian; Liao Junsheng; Deng Dachao; Yu Chunrong; Yuan Li

2007-01-01

The nonlinearity of secondary electron multiplier (SEM) of a thermal ionization mass spectrometer has been researched by using UTB-500 uranium isotope reference material and multi-collecting technique. The results show that the nonlinearity effect of SEM exists in the whole ion counting range, and there is an extreme point of the nonlinearity when the ion counting rate is about 20000 cps. The deviation between measured value of the extreme point and the reference value of the reference sample can be up to 3%, and the nonlinearity obeys logarithm linearity law on both sides of extreme point. A kind of mathematics model of nonlinearity calibration has been put forward. Using this model, the nonlinearity of SEM of TIMS can be calibrated. (authors)

Development of fountain detectors for spectroscopy of secondary electron in SEM

Energy Technology Data Exchange (ETDEWEB)

Agemura, Toshihide [University of Tsukuba (Japan); Iwai, Hideo [National Institute for Materials Science, Tsukuba (Japan); Sekiguchi, Takashi [University of Tsukuba (Japan); National Institute for Materials Science, Tsukuba (Japan)

2017-07-15

To image the variation of surface potential in semiconductors, energy selective secondary electron detector, named fountain detector (FD), was developed. Two types of grids, planar and spherical, were designed and the superiority of latter was demonstrated. The p-n junction of 4H-SiC was observed using spherical FD and the image was much clear than that using conventional detector. (copyright 2017 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Theory and measurement of the electron cloud effect

CERN Document Server

Harkay, K C

1999-01-01

Photoelectrons produced through the interaction of synchrotron radiation and the vacuum chamber walls can be accelerated by a charged particle beam, acquiring sufficient energy to produce secondary electrons (SEs) in collisions with the walls. If the secondary-electron yield (SEY) coefficient of the wall material is greater than one, a runaway condition can develop. In addition to the SEY, the degree of amplification depends on the beam intensity and temporal distribution. As the electron cloud builds up along a train of stored bunches, a transverse perturbation of the head bunch can be communicated to trailing bunches in a wakefield-like interaction with the cloud. The electron cloud effect is especially of concern for the high-intensity PEP-II (SLAC) and KEK B-factories and at the Large Hadron Collider (LHC) at CERN. An initiative was undertaken at the Advanced Photon Source (APS) storage ring to characterize the electron cloud in order to provide realistic limits on critical input parameters in the models ...

Calculated secondary yields for proton broadband using DECAY TURTLE

International Nuclear Information System (INIS)

Sondgeroth, A.

1995-02-01

The calculations for the yields were done by Al Sondgeroth and Anthony Malensek. The authors used the DECAY deck called PBSEC E.DAT from the CMS DECKS library. After obtaining the run modes and calibration modes from the liaison physicist, they made individual decay runs, using DECAY TURTLE from the CMS libraries and a production spectrum subroutine which was modified by Anthony, for each particle and decay mode for all particle types coming out of the target box. Results were weighted according to branching ratios for particles with more than one decay mode. The production spectra were produced assuming beryllium as the target. The optional deuterium target available to broadband will produce slightly higher yields. It should be noted that they did not include pion yields from klong decays because they could not simulate three body decays. Pions from klongs would add a very small fraction to the total yield

Simulations of the Electron Cloud Build Up and Instabilities for Various ILC Damping Ring Configurations

International Nuclear Information System (INIS)

Pivi, Mauro; Raubenheimer, Tor O.; Wang, Lanfa; Ohmi, Kazuhito; Wanzenberg, Rainer; Wolski, Andrzej

2007-01-01

In the beam pipe of the positron damping ring of the International Linear Collider (ILC), an electron cloud may be first produced by photoelectrons and ionization of residual gases and then increased by the secondary emission process. This paper reports the assessment of electron cloud effects in a number of configuration options for the ILC baseline configuration. Careful estimates were made of the secondary electron yield (sometimes in the literature also referred as secondary emission yield SEY or (delta), with a peak value (delta) max ) threshold for electron cloud build-up, and the related single- and coupled-bunch instabilities, as a function of beam current and surface properties for a variety of optics designs. When the configuration for the ILC damping rings was chosen at the end of 2005, the results from these studies were important considerations. On the basis of the joint theoretical and experimental work, the baseline configuration currently specifies a pair of 6 km damping rings for the positron beam, to mitigate the effects of the electron cloud that could present difficulties in a single 6 km ring. However, since mitigation techniques are now estimated to be sufficiently mature, a reduced single 6-km circumference is presently under consideration so as to reduce costs

Can low energy electrons affect high energy physics accelerators?

CERN Document Server

Cimino, R; Furman, M A; Pivi, M; Ruggiero, F; Rumolo, Giovanni; Zimmermann, Frank

2004-01-01

The properties of the electrons participating in the build up of an electron cloud (EC) inside the beam-pipe have become an increasingly important issue for present and future accelerators whose performance may be limited by this effect. The EC formation and evolution are determined by the wall-surface properties of the accelerator vacuum chamber. Thus, the accurate modeling of these surface properties is an indispensible input to simulation codes aimed at the correct prediction of build-up thresholds, electron-induced instability or EC heat load. In this letter, we present the results of surface measurements performed on a prototype of the beam screen adopted for the Large Hadron Collider (LHC), which presently is under construction at CERN. We have measured the total secondary electron yield (SEY) as well as the related energy distribution curves (EDC) of the secondary electrons as a function of incident electron energy. Attention has been paid, for the first time in this context, to the probability at whic...

On the Emission of Electrons from Solid H_2 and D_2 by Bombardment with 1-3 keV Electrons up to Very Large Angles of Incidence

DEFF Research Database (Denmark)

Schou, Jørgen; Sørensen, H.

1982-01-01

at the largest angles. The results agree well with the existing qualitative tendencies described in the literature. The variation with the angle of incidence shows a fair agreement with an estimate based on data for the angular distribution of electrons ejected from ionized hydrogen molecules. In addition......Electron emission, i.e. electron reflection (ER) and secondary electron emission (SEE), was studied for solid H2 and D2 for oblique incidence of 1-3 keV electrons up to an angle of incidence θ of 83°. The ER coefficient η was small at low angles, and rose rapidly with increasing θ above 60......, an ionization cascade treatment leads to an expression for the behavior of the yield of those secondary electrons that are generated directly by the primaries. The agreement with experimental data is good...

Sharing of secondary electrons by in-lens and out-lens detector in low-voltage scanning electron microscope equipped with immersion lens.

Science.gov (United States)

Kumagai, Kazuhiro; Sekiguchi, Takashi

2009-03-01

To understand secondary electron (SE) image formation with in-lens and out-lens detector in low-voltage scanning electron microscopy (LV-SEM), we have evaluated SE signals of an in-lens and an out-lens detector in LV-SEM. From the energy distribution spectra of SEs with various boosting voltages of the immersion lens system, we revealed that the electrostatic field of the immersion lens mainly collects electrons with energy lower than 40eV, acting as a low-pass filter. This effect is also observed as a contrast change in LV-SEM images taken by in-lens and out-lens detectors.

Studies on the bombardment of condensed molecular gases at liquid-He temperatures by keV electrons and light ions

International Nuclear Information System (INIS)

Boergesen, P.

1982-09-01

Films of solid H 2 , D 2 and N 2 were irradiated with keV electrons and ions. Stopping cross sections and ranges of 0.3-10 keV/amu light ions in solid H 2 and D 2 are in good agreement with experimental and theoretical data on gaseous targets. In contrast, both stopping cross section and range measurements in solid N 2 suggest that the stopping here is only about half of that in N 2 -gas. This ''phase-effect'' is further supported by secondary emission measurements. Secondary electron emission coefficients for 2-10 keV H 1 + , H 2 + , H 3 + , D 3 + , D 2 H + , 4 He + , 14 N + and 20 Ne + incident on solids H 2 , D 2 and N 2 are in reasonable agreement with previous results for electron-incidence. The rather large erosion yields for 1-3 keV electrons incident on solid D 2 depend strongly on target thickness (for thin films), but weakly on energy. Bulk yields for 2 keV electrons were approximately 8 H 2 /electron, approximately 4 D 2 /electron and approximately 0.5 N 2 /electron. Secondary ion emission during ion bombardment seems to be predominantly reflected projectiles in the case of N 2 -targets, while it may be explained as sputtered particles from H 2 - and D 2 -targets. Preliminary results on the erosion of solid H 2 and D 2 by keV light ions indicate very large erosion yields (approx. 400 H 2 /atom for 2 keV protons) increasing strongly with energy. (Auth.)

Genetic variability, trait association and path analysis of yield and yield components in mungbean (vigna radiata (L.) wilczek)

International Nuclear Information System (INIS)

Tabasum, A.; Saleem, M.; Aziz, I.

2010-01-01

Genetic variability, heritability along with genetic advance of traits, their association and direct and indirect effects on yield are essential for crop improvement. Ten mungbean genotypes were studied to assess variability and degree to which various plant traits associate with seed yield. Primary and secondary branches, pods per cluster and pod length showed lesser variability while clusters per plant, 100 seed weight and harvest index exhibited intermediate range of variability. Sufficient genetic variability was observed for plant height, pods per plant, total plant weight and seed yield. Moderate to high heritability estimates were found for all traits. Primary and secondary branches per plant, pod length and 100-seed weight exhibited negative and non significant genotypic and phenotypic correlations with seed yield. Plant height showed positive non-significant and significant genotypic and phenotypic correlation. Pods per cluster correlated significantly negative with seed yield. Clusters per plant, pods per plant, total plant weight and harvest index showed positive significant genotypic and phenotypic correlations with seed yield. Positive direct effects were exerted through secondary branches, pods per plant, pod length, 100 seed weight, total plant weight and harvest index while primary branches, plant height, clusters per plant and pods per cluster had negative direct effects. The present findings could be useful for establishing selection criteria for high seed yield in the mungbean breeding. (author)

Current control of the electron beam formed in the magnetron gun with a secondary-emission cathode

International Nuclear Information System (INIS)

Dovbnya, A.N.; Reshetnyak, N.G.; Zakutin, V.V.; Chertishchev, I.A.; Romas'ko, V.P.; Dovbnyan, N.A.

2013-01-01

Data are reported on electron beam generation and beam current control in two types of secondary-emission cathode magnetron guns. The influence of the magnetic field value and field distribution on the formation of the beam and its parameters has been investigated in the electron energy range between 20 and 150 keV. The influence of local magnetic field variations on the cathode and the electron beam characteristics has been studied. The possibility to control the electron beam current in various ways has been demonstrated

Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

Science.gov (United States)

Inada, H; Su, D; Egerton, R F; Konno, M; Wu, L; Ciston, J; Wall, J; Zhu, Y

2011-06-01

We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. Copyright © 2010 Elsevier B.V. All rights reserved.

Measurements of the Secondary Electron Emission of Some Insulators

CERN Document Server

Bozhko, Y.; Hilleret, N.

2013-01-01

Charging up the surface of an insulator after beam impact can lead either to reverse sign of field between the surface and collector of electrons for case of thick sample or appearance of very high internal field for thin films. Both situations discard correct measurements of secondary electron emission (SEE) and can be avoided via reducing the beam dose. The single pulse method with pulse duration of order of tens microseconds has been used. The beam pulsing was carried out by means of an analog switch introduced in deflection plate circuit which toggles its output between "beam on" and "beam off" voltages depending on level of a digital pulse. The error in measuring the beam current for insulators with high value of SEE was significantly reduced due to the use for this purpose a titanium sample having low value of the SEE with DC method applied. Results obtained for some not coated insulators show considerable increase of the SEE after baking out at 3500C what could be explained by the change of work functi...

Structure of the spin polarization spectrum of secondary electrons emitted from nickel

International Nuclear Information System (INIS)

Helman, J.S.

1985-01-01

The main features of the structure observed in the energy resolved spin polarization of secondary electrons emitted from Ni are interpreted in terms of surface and bulk plasmon assisted emission. The model also predicts a measureable shift of the main polarization peak of about 0.3 eV to lower energies as the temperature is raised from room temperature to closely below the Curie temperature. (Author) [pt

Co-Registered In Situ Secondary Electron and Mass Spectral Imaging on the Helium Ion Microscope Demonstrated Using Lithium Titanate and Magnesium Oxide Nanoparticles.

Science.gov (United States)

Dowsett, D; Wirtz, T

2017-09-05

The development of a high resolution elemental imaging platform combining coregistered secondary ion mass spectrometry and high resolution secondary electron imaging is reported. The basic instrument setup and operation are discussed and in situ image correlation is demonstrated on a lithium titanate and magnesium oxide nanoparticle mixture. The instrument uses both helium and neon ion beams generated by a gas field ion source to irradiate the sample. Both secondary electrons and secondary ions may be detected. Secondary ion mass spectrometry (SIMS) is performed using an in-house developed double focusing magnetic sector spectrometer with parallel detection. Spatial resolutions of 10 nm have been obtained in SIMS mode. Both the secondary electron and SIMS image data are very surface sensitive and have approximately the same information depth. While the spatial resolutions are approximately a factor of 10 different, switching between the different images modes may be done in situ and extremely rapidly, allowing for simple imaging of the same region of interest and excellent coregistration of data sets. The ability to correlate mass spectral images on the 10 nm scale with secondary electron images on the nanometer scale in situ has the potential to provide a step change in our understanding of nanoscale phenomena in fields from materials science to life science.

Spin-dependent electron emission from metals in the neutralization of He+ ions

International Nuclear Information System (INIS)

Alducin, M.; Roesler, M.; Juaristi, J.I.; Muino, R. Diez; Echenique, P.M.

2005-01-01

We calculate the spin-polarization of electrons emitted in the neutralization of He + ions interacting with metals. All stages of the emission process are included: the spin-dependent perturbation induced by the projectile, the excitation of electrons in Auger neutralization processes, the creation of a cascade of secondaries, and the escape of the electrons through the surface potential barrier. The model allows us to explain in quantitative terms the measured spin-polarization of the yield in the interaction of spin-polarized He + ions with paramagnetic surfaces, and to disentangle the role played by each of the involved mechanisms. We show that electron-electron scattering processes at the surface determine the spin-polarization of the total yield. High energy emitted electrons are the ones providing direct information on the He + ion neutralization process and on the electronic properties of the surface

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Directory of Open Access Journals (Sweden)

Joon Huang Chuah

2011-01-01

Full Text Available This paper presents a novel method of detecting secondary electrons generated in the scanning electron microscope (SEM. The method suggests that the photomultiplier tube (PMT, traditionally used in the Everhart-Thornley (ET detector, is to be replaced with a configurable multipixel solid-state photon detector offering the advantages of smaller dimension, lower supply voltage and power requirements, and potentially cheaper product cost. The design of the proposed detector has been implemented using a standard 0.35 μm CMOS technology with optical enhancement. This microchip comprises main circuit constituents of an array of photodiodes connecting to respective noise-optimised transimpedance amplifiers (TIAs, a selector-combiner (SC circuit, and a postamplifier (PA. The design possesses the capability of detecting photons with low input optical power in the range of 1 nW with 100 μm × 100 μm sized photodiodes and achieves a total amplification of 180 dBΩ at the output.

Genetic basis of yield and some yield related traits in basmati rice

International Nuclear Information System (INIS)

Saleem, M.Y.; Haq, M.A.; Mirza, J.I.

2010-01-01

Additive, dominance and epistasis components of genetic variation for yield and some yield related traits were assessed through modified triple test cross technique in Basmati rice. Epistasis was found an important part of genetic variation for plant height, tillers per plant, secondary branches per panicle, grains per panicle, 1000-grain weight and yield per plant except primary branches per panicle and panicle length. Bifurcation of epistasis showed that additive x additive (i) type and additive x dominance + dominance x dominance (j + l) types of non-allelic interactions were involved in the expression of these traits. Additive and dominance type of gene action influenced the expression of primary branches per panicle and panicle length. No evidence of directional dominance was observed for these two traits. For plant height, tillers per plant, secondary branches per panicle, grains per panicle, 1000-grain weight and yield per plant, recurrent selection or bi parental mating may be exercised in F2 and following generations however, selection of desired plants may be postponed till F5 or F6 generations to permit maximum obsession of epistatic effects to develop desired cultivar(s) in Basmati rice.(author)

CLEARING OF ELECTRON CLOUD IN SNS

International Nuclear Information System (INIS)

WANG, L.; LEE, Y.Y.; RAPRIA, D.

2004-01-01

In this paper we describe a mechanism using the clearing electrodes to remove the electron cloud in the Spallation Neutron Source (SNS) accumulator ring, where strong multipacting could happen at median clearing fields. A similar phenomenon was reported in an experimental study at Los Alamos laboratory's Proton Synchrotron Ring (PSR). We also investigated the effectiveness of the solenoid's clearing mechanism in the SNS, which differs from the short bunch case, such as in B-factories. The titanium nitride (TiN) coating of the chamber walls was applied to reduce the secondary electron yield (SEY)

Multiplicity of secondary electrons emitted by carbon thin targets by impact of H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles at MeV energies; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l`impact de projectiles H{sup 0}, H{sub 2}{sup +} et H{sub 3}{sup +} d`energie de l`ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Zvonimir [Inst. de Physique Nucleaire, Lyon-1 Univ., 69 - Villeurbanne (France)

1997-06-24

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25 - 2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. Phenomenological and theoretical descriptions as well as a summary of the main theoretical models are the subjects of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of the thin carbon foils crossed by an energetic projectile is described in the chapter two. In this chapter there are also presented the method and the algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H{sup 0} atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of the ions with solids. The role of the proximity of the protons, molecular ions fragments, upon the amplitude of these collected effects is evidenced from the study of the statistics of forward emission. The experiments allowed us to shed light on various aspects of atom and polyatomic ion interactions with solid surfaces. (author) 136 refs., 41 figs., 3 tabs.

Signal yields of keV electronic recoils and their discrimination from nuclear recoils in liquid xenon

Science.gov (United States)

Aprile, E.; Aalbers, J.; Agostini, F.; Alfonsi, M.; Amaro, F. D.; Anthony, M.; Arneodo, F.; Barrow, P.; Baudis, L.; Bauermeister, B.; Benabderrahmane, M. L.; Berger, T.; Breur, P. A.; Brown, A.; Brown, E.; Bruenner, S.; Bruno, G.; Budnik, R.; Bütikofer, L.; Calvén, J.; Cardoso, J. M. R.; Cervantes, M.; Cichon, D.; Coderre, D.; Colijn, A. P.; Conrad, J.; Cussonneau, J. P.; Decowski, M. P.; de Perio, P.; di Gangi, P.; di Giovanni, A.; Diglio, S.; Eurin, G.; Fei, J.; Ferella, A. D.; Fieguth, A.; Fulgione, W.; Gallo Rosso, A.; Galloway, M.; Gao, F.; Garbini, M.; Geis, C.; Goetzke, L. W.; Grandi, L.; Greene, Z.; Grignon, C.; Hasterok, C.; Hogenbirk, E.; Howlett, J.; Itay, R.; Kaminsky, B.; Kazama, S.; Kessler, G.; Kish, A.; Landsman, H.; Lang, R. F.; Lellouch, D.; Levinson, L.; Lin, Q.; Lindemann, S.; Lindner, M.; Lombardi, F.; Lopes, J. A. M.; Mahlstedt, J.; Manfredini, A.; Maris, I.; Marrodán Undagoitia, T.; Masbou, J.; Massoli, F. V.; Masson, D.; Mayani, D.; Messina, M.; Micheneau, K.; Molinario, A.; Morâ, K.; Murra, M.; Naganoma, J.; Ni, K.; Oberlack, U.; Pakarha, P.; Pelssers, B.; Persiani, R.; Piastra, F.; Pienaar, J.; Pizzella, V.; Piro, M.-C.; Plante, G.; Priel, N.; Ramírez García, D.; Rauch, L.; Reichard, S.; Reuter, C.; Rizzo, A.; Rupp, N.; Saldanha, R.; Dos Santos, J. M. F.; Sartorelli, G.; Scheibelhut, M.; Schindler, S.; Schreiner, J.; Schumann, M.; Scotto Lavina, L.; Selvi, M.; Shagin, P.; Shockley, E.; Silva, M.; Simgen, H.; Sivers, M. V.; Stein, A.; Thers, D.; Tiseni, A.; Trinchero, G.; Tunnell, C.; Vargas, M.; Wang, H.; Wang, Z.; Wei, Y.; Weinheimer, C.; Wittweg, C.; Wulf, J.; Ye, J.; Zhang, Y.; Zhu, T.; Xenon Collaboration

2018-05-01

We report on the response of liquid xenon to low energy electronic recoils below 15 keV from beta decays of tritium at drift fields of 92 V /cm , 154 V /cm and 366 V /cm using the XENON100 detector. A data-to-simulation fitting method based on Markov Chain Monte Carlo is used to extract the photon yields and recombination fluctuations from the experimental data. The photon yields measured at the two lower fields are in agreement with those from literature; additional measurements at a higher field of 366 V /cm are presented. The electronic and nuclear recoil discrimination as well as its dependence on the drift field and photon detection efficiency are investigated at these low energies. The results provide new measurements in the energy region of interest for dark matter searches using liquid xenon.

Secondary Emission Calorimeter Sensor Development

Science.gov (United States)

Winn, David R.; Onel, Yasar

2012-12-01

In a Secondary Emission electron(SEe) detector module, Secondary Emission electrons (SEe) are generated from an SE surface/cathode, when charged hadronic or electromagnetic particles, particularly shower particles, penetrate an SE sampling module placed between absorber materials (Fe, Cu, Pb, W etc) in calorimeters. The SE cathode is a thin (10-50 nm thick) film (simple metal-oxides, or other higher yield materials) on the surface of a metal plate, which serves as the entrance “window” to a compact vacuum vessel (metal or metal-ceramic); this SE film cathode is analogous to a photocathode, and the SEe are similar to p.e., which are then amplified by dynodes, also is in a PMT. SE sensor modules can make use of electrochemically etched/machined or laser-cut metal mesh dynode sheets, as large as ~30 cm square, to amplify the Secondary Emission Electrons (SEe), much like those that compact metal mesh or mesh dynode PMT's use to amplify p.e.'s. The construction requirements easier than a PMT, since the entire final assembly can be done in air; there are no critical controlled thin film depositions, cesiation or other oxygen-excluded processes or other required vacuum activation, and consequently bake-out can be a refractory temperatures; the module is sealed by normal vacuum techniques (welding or brazing or other high temperature joinings), with a simple final heated vacuum pump-out and tip-off. The modules envisioned are compact, high gain, high speed, exceptionally radiation damage resistant, rugged, and cost effective, and can be fabricated in arbitrary tileable shapes. The SE sensor module anodes can be segmented transversely to sizes appropriate to reconstruct electromagnetic cores with high precision. The GEANT4 and existing calorimeter data estimated calorimeter response performance is between 35-50 Secondary Emission electrons per GeV, in a 1 cm thick Cu absorber calorimeter, with a gain per SEe > 105 per SEe, and an e/pi<1.2. The calorimeter pulse width is

Detailed characterization of electron sources yielding first demonstration of European X-ray Free-Electron Laser beam quality

Directory of Open Access Journals (Sweden)

F. Stephan

2010-02-01

Full Text Available The photoinjector test facility at DESY, Zeuthen site (PITZ, was built to develop and optimize photoelectron sources for superconducting linacs for high-brilliance, short-wavelength free-electron laser (FEL applications like the free-electron laser in Hamburg (FLASH and the European x-ray free-electron laser (XFEL. In this paper, the detailed characterization of two laser-driven rf guns with different operating conditions is described. One experimental optimization of the beam parameters was performed at an accelerating gradient of about 43  MV/m at the photocathode and the other at about 60  MV/m. In both cases, electron beams with very high phase-space density have been demonstrated at a bunch charge of 1 nC and are compared with corresponding simulations. The rf gun optimized for the lower gradient has surpassed all the FLASH requirements on beam quality and rf parameters (gradient, rf pulse length, repetition rate and serves as a spare gun for this facility. The rf gun studied with increased accelerating gradient at the cathode produced beams with even higher brightness, yielding the first demonstration of the beam quality required for driving the European XFEL: The geometric mean of the normalized projected rms emittance in the two transverse directions was measured to be 1.26±0.13  mm mrad for a 1-nC electron bunch. When a 10% charge cut is applied excluding electrons from those phase-space regions where the measured phase-space density is below a certain level and which are not expected to contribute to the lasing process, the normalized projected rms emittance is about 0.9 mm mrad.

Materials Characterization at Utah State University: Facilities and Knowledge-base of Electronic Properties of Materials Applicable to Spacecraft Charging

Science.gov (United States)

Dennison, J. R.; Thomson, C. D.; Kite, J.; Zavyalov, V.; Corbridge, Jodie

2004-01-01

In an effort to improve the reliability and versatility of spacecraft charging models designed to assist spacecraft designers in accommodating and mitigating the harmful effects of charging on spacecraft, the NASA Space Environments and Effects (SEE) Program has funded development of facilities at Utah State University for the measurement of the electronic properties of both conducting and insulating spacecraft materials. We present here an overview of our instrumentation and capabilities, which are particularly well suited to study electron emission as related to spacecraft charging. These measurements include electron-induced secondary and backscattered yields, spectra, and angular resolved measurements as a function of incident energy, species and angle, plus investigations of ion-induced electron yields, photoelectron yields, sample charging and dielectric breakdown. Extensive surface science characterization capabilities are also available to fully characterize the samples in situ. Our measurements for a wide array of conducting and insulating spacecraft materials have been incorporated into the SEE Charge Collector Knowledge-base as a Database of Electronic Properties of Materials Applicable to Spacecraft Charging. This Database provides an extensive compilation of electronic properties, together with parameterization of these properties in a format that can be easily used with existing spacecraft charging engineering tools and with next generation plasma, charging, and radiation models. Tabulated properties in the Database include: electron-induced secondary electron yield, backscattered yield and emitted electron spectra; He, Ar and Xe ion-induced electron yields and emitted electron spectra; photoyield and solar emittance spectra; and materials characterization including reflectivity, dielectric constant, resistivity, arcing, optical microscopy images, scanning electron micrographs, scanning tunneling microscopy images, and Auger electron spectra. Further

N2 Dissociation In The Mesosphere Due To Secondary Electrons During A Solar Proton Event: The Effect On Atomic Nitrogen and Nitric Oxide

Science.gov (United States)

Verronen, P. T.; Shematovich, V. I.; Bisikalo, D. V.; Turunen, E.; Ulich, Th.

Solar proton events have an effect on the middle atmospheric odd nitrogen chem- istry. During a solar proton event high energy protons enter Earth's middle atmosphere where they ionize ambient gas. Ionization leads to production of atomic nitrogen, and further to production of nitric oxide, through ion chemistry. In addition, ionization processes produce secondary electrons that, if possessing 9.76 eV or more energy, dissociate N2 providing an additional source of atomic nitrogen. We have calculated mesospheric N2 dissociation rate due to secondary electrons dur- ing a solar proton event. Further, we have studied the effect on atomic nitrogen and nitric oxide at altitudes between 50 and 90 km. It was found that N2 is efficiently dis- sociated in the lower mesosphere by secondary electrons, with rates up to 103 cm-3 s-1 at 50 km. Thus, secondary electrons significantly add to odd nitrogen produc- tion. As a result of N2 dissociation, atomic nitrogen is greatly enhanced in both N(4S) and N(2D) states by 259% and 1220% maximum increases at 50 km, respectively. This further leads to a maximum increase of 16.5% in NO concentration at 61 km via chemical reactions. In our study a Monte Carlo model was used to calculate the total ionization rate and secondary electrons flux due to precipitating protons. These where then used as input to a detailed ion and neutral chemistry model and a steady-state solution was calcu- lated for two cases: With and without N2 dissociation due to secondary electrons.

Study of the secondary electron emission during bombardment of metal targets by positive D{sup +} and D{sub 2}{sup +} ions (1960); Etude de l'emission secondaire d'electrons au cours du bombardement de cibles metalliques par des ions positifs D{sup +} et D{sub 2}{sup +} (1960)

Energy Technology Data Exchange (ETDEWEB)

Leroy, J [Commissariat a l' Energie Atomique, Saclay (France).Centre d' Etudes Nucleaires; Prelec, K [Institut Rudjer Boskovic, Zagreb (Croatia)

1960-07-01

The secondary electron yield {gamma}-bar due to primary positive ions D{sup +} and D{sup +}{sub 2} has been measured in the 70 keV to 300 keV ion energy range. Several metallic targets have been used. The variation of this yield with the angle of incidence is proportional to sec {theta} where {theta} is the angle between the beam of primary ions and the normal to the target surface. The values {gamma}-bar decrease for increasing energy ions. At a given energy all the targets tried gave approximately the same electron yield. (author) [French] Le facteur d'emission secondaire a ete mesure pour des ions positifs D{sup +} et D{sup +}{sub 2} ayant une energie comprise entre 70 keV et 300 keV, sur differentes cibles metalliques. La variation de ce facteur avec l'angle d'incidence suit une loi de la forme {gamma}{sub 0} sec {theta}, {theta} etant l'angle entre le faisceau et la normale a la cible. Les valeurs de {gamma}-bar trouvees decroissent lorsque l'energie des ions incidents augmente, mais sont assez voisines les unes des autres, a une energie donnee, pour les differentes cibles essayees. (auteur)

Reflection of the energy structure of a tungsten monocrystal nearsurface area in the secondary electron spectrum

International Nuclear Information System (INIS)

Artamonov, O.M.; Smirnov, O.M.; Terekhov, A.N.

1982-01-01

Formation of secondary electron energy spectrum during emission from the crystal layer near the surface has been considered, at that layer energy structure can be different from volumetric energy structure. Its thickness depends on the predominant mechanism of electron scattering and is determined by corresponding phenomenological parameters. It is shown that the structure in the secondary electron spectrum appears in the case when energy structure of emitting monocrystal layer can not be described in the approximation of almost free electron gas and, as experimental investigations show, approaches energy zone structure of its volume. It is also show that in the case when the energy structure of the emitting layer is satisfactorily described with the model of almost free electron gas, the SE spectrum is characterized with traditional cascade minimum. Experimental investigation of SE energy distribution was carried out for the W monocrystalline face (110). It was established that distinct structure in the SE spectrum appears only after electrochemical polishing of the specimen surface. It is related to the appearance of ''far'' order in the monocrystal emission layer on initially disturbed tungsten surface during such treatment. Disturbance of tungsten monocrystal surface structure on its oxidation in O 2 atmosphere results in the appearance of the cascade maximum and disappearance of distinct peculiarities in the SE spectrum

Time-dependent first-principles study of angle-resolved secondary electron emission from atomic sheets

Science.gov (United States)

Ueda, Yoshihiro; Suzuki, Yasumitsu; Watanabe, Kazuyuki

2018-02-01

Angle-resolved secondary electron emission (ARSEE) spectra were analyzed for two-dimensional atomic sheets using a time-dependent first-principles simulation of electron scattering. We demonstrate that the calculated ARSEE spectra capture the unoccupied band structure of the atomic sheets. The excitation dynamics that lead to SEE have also been revealed by the time-dependent Kohn-Sham decomposition scheme. In the present study, the mechanism for the experimentally observed ARSEE from atomic sheets is elucidated with respect to both energetics and the dynamical aspects of SEE.

Angular distribution measurements of photo-neutron yields produced by 2.0 GeV electrons incident on thick targets

International Nuclear Information System (INIS)

Lee, H. S.; Ban, S.; Sanami, T.; Takahashi, K.; Sato, T.; Shin, K.; Chung, C.

2005-01-01

A study of differential photo-neutron yields by irradiation with 2 GeV electrons has been carried out. In this extension of a previous study in which measurements were made at an angle of 90 deg. relative to incident electrons, the differential photo-neutron yield was obtained at two other angles, 48 deg. and 140 deg., to study its angular characteristics. Photo-neutron spectra were measured using a pulsed beam time-of-flight method and a BC418 plastic scintillator. The reliable range of neutron energy measurement was 8-250 MeV. The neutron spectra were measured for 10 Xo-thick Cu, Sn, W and Pb targets. The angular distribution characteristics, together with the previous results for 90 deg., are presented in the study. The experimental results are compared with Monte Carlo calculation results. The yields predicted by MCNPX 2.5 tend to underestimate the measured ones. The same trend holds for the comparison results using the EGS4 and PICA3 codes. (authors)

Angular distribution measurements of photo-neutron yields produced by 2.0 GeV electrons incident on thick targets.

Science.gov (United States)

Lee, Hee-Seock; Ban, Syuichi; Sanami, Toshiya; Takahashi, Kazutoshi; Sato, Tatsuhiko; Shin, Kazuo; Chung, Chinwha

2005-01-01

A study of differential photo-neutron yields by irradiation with 2 GeV electrons has been carried out. In this extension of a previous study in which measurements were made at an angle of 90 degrees relative to incident electrons, the differential photo-neutron yield was obtained at two other angles, 48 degrees and 140 degrees, to study its angular characteristics. Photo-neutron spectra were measured using a pulsed beam time-of-flight method and a BC418 plastic scintillator. The reliable range of neutron energy measurement was 8-250 MeV. The neutron spectra were measured for 10 Xo-thick Cu, Sn, W and Pb targets. The angular distribution characteristics, together with the previous results for 90 degrees, are presented in the study. The experimental results are compared with Monte Carlo calculation results. The yields predicted by MCNPX 2.5 tend to underestimate the measured ones. The same trend holds for the comparison results using the EGS4 and PICA3 codes.

Molecular dynamics simulations with electronic stopping can reproduce experimental sputtering yields of metals impacted by large cluster ions

Science.gov (United States)

Tian, Jiting; Zhou, Wei; Feng, Qijie; Zheng, Jian

2018-03-01

An unsolved problem in research of sputtering from metals induced by energetic large cluster ions is that molecular dynamics (MD) simulations often produce sputtering yields much higher than experimental results. Different from the previous simulations considering only elastic atomic interactions (nuclear stopping), here we incorporate inelastic electrons-atoms interactions (electronic stopping, ES) into MD simulations using a friction model. In this way we have simulated continuous 45° impacts of 10-20 keV C60 on a Ag(111) surface, and found that the calculated sputtering yields can be very close to the experimental results when the model parameter is appropriately assigned. Conversely, when we ignore the effect of ES, the yields are much higher, just like the previous studies. We further expand our research to the sputtering of Au induced by continuous keV C60 or Ar100 bombardments, and obtain quite similar results. Our study indicates that the gap between the experimental and the simulated sputtering yields is probably induced by the ignorance of ES in the simulations, and that a careful treatment of this issue is important for simulations of cluster-ion-induced sputtering, especially for those aiming to compare with experiments.

Simulation of the electron cloud density in BEPC II

International Nuclear Information System (INIS)

Liu Yudong; Guo Zhiyuan; Wang Jiuqing

2004-01-01

Electron Cloud Instability (ECI) may take place in positron storage ring when the machine is operated with multi-bunch positron beam. According to the actual shape of the vacuum chamber in the BEPC II, a program has been developed. With the code, authors can calculate the electron density in the chamber with different length of antechamber and the different secondary electron yield respectively. By the simulation, the possibility to put clearing electrodes in the chamber to reduce the electron density in the central region of the chamber is investigated. The simulation provides meaningful and important results for the BEPC II project and electron cloud instability research

Studying electron-PAG interactions using electron-induced fluorescence

Science.gov (United States)

Narasimhan, Amrit; Grzeskowiak, Steven; Ostrander, Jonathan; Schad, Jonathon; Rebeyev, Eliran; Neisser, Mark; Ocola, Leonidas E.; Denbeaux, Gregory; Brainard, Robert L.

2016-03-01

In extreme ultraviolet (EUV) lithography, 92 eV photons are used to expose photoresists. Typical EUV resists are organic-based and chemically amplified using photoacid generators (PAGs). Upon exposure, PAGs produce acids which catalyze reactions that result in changes in solubility. In EUV lithography, photo- and secondary electrons (energies of 10- 80 eV) play a large role in PAG acid-production. Several mechanisms for electron-PAG interactions (e.g. electron trapping, and hole-initiated chemistry) have been proposed. The aim of this study is to explore another mechanism - internal excitation - in which a bound PAG electron can be excited by receiving energy from another energetic electron, causing a reaction that produces acid. This paper explores the mechanism of internal excitation through the analogous process of electron-induced fluorescence, in which an electron loses energy by transferring that energy to a molecule and that molecule emits a photon rather than decomposing. We will show and quantify electron-induced fluorescence of several fluorophores in polymer films to mimic resist materials, and use this information to refine our proposed mechanism. Relationships between the molecular structure of fluorophores and fluorescent quantum yield may aid in the development of novel PAGs for EUV lithography.

Sub-band gap photo-enhanced secondary electron emission from high-purity single-crystal chemical-vapor-deposited diamond

International Nuclear Information System (INIS)

Yater, J. E.; Shaw, J. L.; Pate, B. B.; Feygelson, T. I.

2016-01-01

Secondary-electron-emission (SEE) current measured from high-purity, single-crystal (100) chemical-vapor-deposited diamond is found to increase when sub-band gap (3.06 eV) photons are incident on the hydrogenated surface. Although the light does not produce photoemission directly, the SEE current increases by more than a factor of 2 before saturating with increasing laser power. In energy distribution curves (EDCs), the emission peak shows a corresponding increase in intensity with increasing laser power. However, the emission-onset energy in the EDCs remains constant, indicating that the bands are pinned at the surface. On the other hand, changes are observed on the high-energy side of the distribution as the laser power increases, with a well-defined shoulder becoming more pronounced. From an analysis of this feature in the EDCs, it is deduced that upward band bending is present in the near-surface region during the SEE measurements and this band bending suppresses the SEE yield. However, sub-band gap photon illumination reduces the band bending and thereby increases the SEE current. Because the bands are pinned at the surface, we conclude that the changes in the band levels occur below the surface in the electron transport region. Sample heating produces similar effects as observed with sub-band gap photon illumination, namely, an increase in SEE current and a reduction in band bending. However, the upward band bending is not fully removed by either increasing laser power or temperature, and a minimum band bending of ∼0.8 eV is established in both cases. The sub-band gap photo-excitation mechanism is under further investigation, although it appears likely at present that defect or gap states play a role in the photo-enhanced SEE process. In the meantime, the study demonstrates the ability of visible light to modify the electronic properties of diamond and enhance the emission capabilities, which may have potential impact for diamond-based vacuum electron

Secondary ion formation during electronic and nuclear sputtering of germanium

Science.gov (United States)

Breuer, L.; Ernst, P.; Herder, M.; Meinerzhagen, F.; Bender, M.; Severin, D.; Wucher, A.

2018-06-01

Using a time-of-flight mass spectrometer attached to the UNILAC beamline located at the GSI Helmholtz Centre for Heavy Ion Research, we investigate the formation of secondary ions sputtered from a germanium surface under irradiation by swift heavy ions (SHI) such as 5 MeV/u Au by simultaneously recording the mass spectra of the ejected secondary ions and their neutral counterparts. In these experiments, the sputtered neutral material is post-ionized via single photon absorption from a pulsed, intensive VUV laser. After post-ionization, the instrument cannot distinguish between secondary ions and post-ionized neutrals, so that both signals can be directly compared in order to investigate the ionization probability of different sputtered species. In order to facilitate an in-situ comparison with typical nuclear sputtering conditions, the system is also equipped with a conventional rare gas ion source delivering a 5 keV argon ion beam. For a dynamically sputter cleaned surface, it is found that the ionization probability of Ge atoms and Gen clusters ejected under electronic sputtering conditions is by more than an order of magnitude higher than that measured for keV sputtered particles. In addition, the mass spectra obtained under SHI irradiation show prominent signals of GenOm clusters, which are predominantly detected as positive or negative secondary ions. From the m-distribution for a given Ge nuclearity n, one can deduce that the sputtered material must originate from a germanium oxide matrix with approximate GeO stoichiometry, probably due to residual native oxide patches even at the dynamically cleaned surface. The results clearly demonstrate a fundamental difference between the ejection and ionization mechanisms in both cases, which is interpreted in terms of corresponding model calculations.

Modeling secondary electron emission from nanostructured materials in helium ion microscope

International Nuclear Information System (INIS)

Ohya, K.; Yamanaka, T.

2013-01-01

Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

Interpretation of secondary electron images obtained using a low vacuum SEM

International Nuclear Information System (INIS)

Toth, M.; Thiel, B.L.; Donald, A.M.

2003-01-01

Charging of insulators in a variable pressure environment was investigated in the context of secondary electron (SE) image formation. Sample charging and ionized gas molecules present in a low vacuum specimen chamber can give rise to SE image contrast. 'Charge-induced' SE contrast reflects lateral variations in the charge state of a sample caused by electron irradiation during and prior to image acquisition. This contrast corresponds to SE emission current alterations produced by sub-surface charge deposited by the electron beam. 'Ion-induced' contrast results from spatial inhomogeneities in the extent of SE signal inhibition caused by ions in the gaseous environment of a low vacuum scanning electron microscope (SEM). The inhomogeneities are caused by ion focusing onto regions of a sample that correspond to local minima in the magnitude of the surface potential (generated by sub-surface trapped charge), or topographic asperities. The two types of contrast exhibit characteristic dependencies on microscope operating parameters such as scan speed, beam current, gas pressure, detector bias and working distance. These dependencies, explained in terms of the behavior of the gaseous environment and sample charging, can serve as a basis for a correct interpretation of SE images obtained using a low vacuum SEM

Electron transport phosphorylation in rumen butyrivibrios: unprecedented ATP yield for glucose fermentation to butyrate

Directory of Open Access Journals (Sweden)

Timothy eHackmann

2015-06-01

Full Text Available From a genomic analysis of rumen butyrivibrios (Butyrivibrio and Pseudobutyrivibrio spp., we have re-evaluated the contribution of electron transport phosphorylation to ATP formation in this group. This group is unique in that most (76% genomes were predicted to possess genes for both Ech and Rnf transmembrane ion pumps. These pumps act in concert with the NifJ and Bcd-Etf to form a electrochemical potential (ΔμH+ and ΔμNa+, which drives ATP synthesis by electron transport phosphorylation. Of the 62 total butyrivibrio genomes currently available from the Hungate 1000 project, all 62 were predicted to possess NifJ, which reduces oxidized ferredoxin (Fdox during pyruvate conversion to acetyl-CoA. All 62 possessed all subunits of Bcd-Etf, which reduces Fdox and oxidizes reduced NAD (NADred during crotonyl-CoA reduction. Additionally, 61 genomes possessed all subunits of the Rnf, which generates ΔμH+ or ΔμNa+ from oxidation of reduced Fd and reduction of oxidized NAD (NADox. Further, 47 genomes possessed all 6 subunits of the Ech, which generates ΔμH+ from oxidation of reduced Fd (Fdred. For glucose fermentation to butyrate and H2, the electrochemical potential established should drive synthesis of ~1.5 ATP by the F0F1-ATP synthase (possessed by all 62 genomes. The total yield is ~4.5 ATP/glucose after accounting for 3 ATP formed by classic substrate-level phosphorylation, and it is one the highest yields for any glucose fermentation. The yield was the same when unsaturated fatty acid bonds, not H+, served as the electron acceptor (as during biohydrogenation. Possession of both Ech and Rnf had been previously documented in only a few sulfate-reducers, was rare in other rumen prokaryotic genomes in our analysis, and may confer an energetic advantage to rumen butyrivibrios. This unique energy conservation system might enhance the butyrivibrios’ ability to overcome growth inhibition by unsaturated fatty acids, as postulated herein.

Contribution of backscattered electrons to the total electron yield ...

Indian Academy of Sciences (India)

a better fit to the experiment compared to the power-law. Keywords ... is based on many different mechanisms, for example, ion-induced secondary elec- ... modified these theories using a Lindhard power potential formalism to describe SE ..... principle. The constant-loss indicates the importance of straggling of the primaries.

Bremsstrahlung X rays from Jovian auroral electrons

International Nuclear Information System (INIS)

Barbosa, D.D.

1990-01-01

The spectrum of X rays from the planet Jupiter is calculated according to an auroral electron beam model. The electrons are assumed to be accelerated by a field-aligned potential drop and penetrate into the atmosphere as a Maxwellian beam of primaries which are scattered, degraded in energy, and merged with a population of ionization secondaries having a power law energy distribution. The soft X rays observed by the Einstein Observatory satelltie are due to bremsstrahlung from the sedondary electrons in the H 2 atmosphere. A good match to the X ray data is obtained if the power law spectral index of the secondary electrons, γ e , is ≅ 2, yielding a power law slope for the photon flux γ X = γ e + 1 ≅ 3. The X ray intensity is best reconciled with a beam of primaries having a characteristic energy 30-100 keV and penetrating the homopause with an auroral energy flux typically of 10-20 ergs cm -2 s -1 but no greater than 50 ergs cm -2 s -1

Characterization of secondary electron collection for energy recovery from high energy ions with a magnetic field

International Nuclear Information System (INIS)

Hagihara, Shota; Wada, Takayuki; Nakamoto, Satoshi; Takeno, Hiromasa; Yasaka, Yasuyoshi; Furuyama, Yuichi; Taniike, Akira

2015-01-01

A traveling wave direct energy converter (TWDEC) is expected to be used as an energy recovery device for fast protons produced during the D- 3 He nuclear fusion reaction. Some protons, however, are not fully decelerated and pass through the device. A secondary electron direct energy converter (SEDEC) was proposed as an additional device to recover the protons passing through a TWDEC. In our previous study, magnetic field was applied for efficient secondary electron (SE) collection, but the SEs were reflected close to the collector due to the magnetic mirror effect and the collection was degraded. Herein, a new arrangement of magnets is proposed to be set away from the collector, and experiments in various conditions are performed. An appropriate arrangement away from the collector resulted in the improvement of SE collection. (author)

Boosting biomethane yield and production rate with graphene: The potential of direct interspecies electron transfer in anaerobic digestion.

Science.gov (United States)

Lin, Richen; Cheng, Jun; Zhang, Jiabei; Zhou, Junhu; Cen, Kefa; Murphy, Jerry D

2017-09-01

Interspecies electron transfer between bacteria and archaea plays a vital role in enhancing energy efficiency of anaerobic digestion (AD). Conductive carbon materials (i.e. graphene nanomaterial and activated charcoal) were assessed to enhance AD of ethanol (a key intermediate product after acidogenesis of algae). The addition of graphene (1.0g/L) resulted in the highest biomethane yield (695.0±9.1mL/g) and production rate (95.7±7.6mL/g/d), corresponding to an enhancement of 25.0% in biomethane yield and 19.5% in production rate. The ethanol degradation constant was accordingly improved by 29.1% in the presence of graphene. Microbial analyses revealed that electrogenic bacteria of Geobacter and Pseudomonas along with archaea Methanobacterium and Methanospirillum might participate in direct interspecies electron transfer (DIET). Theoretical calculations provided evidence that graphene-based DIET can sustained a much higher electron transfer flux than conventional hydrogen transfer. Copyright © 2017 Elsevier Ltd. All rights reserved.

ETRAN, Electron Transport and Gamma Transport with Secondary Radiation in Slab by Monte-Carlo

International Nuclear Information System (INIS)

1992-01-01

A - Nature of physical problem solved: ETRAN computes the transport of electrons and photons through plane-parallel slab targets that have a finite thickness in one dimension and are unbound in the other two-dimensions. The incident radiation can consist of a beam of either electrons or photons with specified spectral and directional distribution. Options are available by which all orders of the electron-photon cascade can be included in the calculation. Thus electrons are allowed to give rise to secondary knock-on electrons, continuous Bremsstrahlung and characteristic x-rays; and photons are allowed to produce photo-electrons, Compton electrons, and electron- positron pairs. Annihilation quanta, fluorescence radiation, and Auger electrons are also taken into account. If desired, the Monte- Carlo histories of all generations of secondary radiations are followed. The information produced by ETRAN includes the following items: 1) reflection and transmission of electrons or photons, differential in energy and direction; 2) the production of continuous Bremsstrahlung and characteristic x-rays by electrons and the emergence of such radiations from the target (differential in photon energy and direction); 3) the spectrum of the amounts of energy left behind in a thick target by an incident electron beam; 4) the deposition of energy and charge by an electron beam as function of the depth in the target; 5) the flux of electrons, differential in energy, as function of the depth in the target. B - Method of solution: A programme called DATAPAC-4 takes data for a particular material from a library tape and further processes them. The function of DATAPAC-4 is to produce single-scattering and multiple-scattering data in the form of tabular arrays (again stored on magnetic tape) which facilitate the rapid sampling of electron and photon Monte Carlo histories in ETRAN. The photon component of the electron-photon cascade is calculated by conventional random sampling that imitates

Nature of the concentration thresholds of europium atom yield from the oxidized tungsten surface under electron stimulated desorption

CERN Document Server

Davydov, S Y

2002-01-01

The nature of the electron-stimulated desorption (ESD) of the europium atoms by the E sub e irradiating electrons energies, equal to 50 and 80 eV, as well as peculiarities of the Eu atoms yield dependence on their concentration on the oxidized tungsten surface are discussed. It is shown, that the ESD originates by the electron transition from the interval 5p- or 5s shell of the tungsten surface atom onto the oxygen external unfilled 2p-level

Surface potential measurement of the insulator with secondary electron caused by negative ion implantation

International Nuclear Information System (INIS)

Tsuji, Hiroshi; Toyota, Yoshitaka; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1994-01-01

Ion implantation has the merit of the good controllability of implantation profile and low temperature process, and has been utilized for the impurity introduction in LSI production. However, positive ion implantation is carried out for insulator or insulated conductor substrates, their charged potential rises, which is a serious problem. As the requirement for them advanced, charge compensation method is not the effective means for resolving it. The negative ion implantation in which charging is little was proposed. When the experiment on the negative ion implantation into insulated conductors was carried out, it was verified that negative ion implantation is effective as the implantation process without charging. The method of determining the charged potential of insulators at the time of negative ion implantation by paying attention to the energy distribution of the secondary electrons emitted from substrates at the time was devised. The energy analyzer for measuring the energy distribution of secondary electrons was made, and the measurement of the charged potential of insulators was carried out. The principle of the measurement, the measuring system and the experimental results are reported. (K.I.)

Note: Theoretical study on the gas pressure dependence of x-ray yield in TE111 cavity based electron cyclotron resonance x-ray source

International Nuclear Information System (INIS)

Selvakumaran, T. S.; Sen, Soubhadra; Baskaran, R.

2014-01-01

Adopting Langevin methodology, a pressure dependent frictional force term which represents the collisional effect is added to the Lorentz equation. The electrons are assumed to be starting from the uniformly distributed co-ordinates on the central plane. The trajectory of each electron is numerically simulated by solving the modified Lorentz equation for a given pressure. The Bremsstrahlung x-ray energy spectrum for each electron crossing the cavity wall boundary is obtained using the Duane-Hunt law. The total x-ray yield is estimated by adding the spectral contribution of each electron. The calculated yields are compared with the experimental results and a good agreement is found

Increased kilo-electron-volt x-ray yields from Z-pinch plasmas by mixing elements of similar atomic numbers

International Nuclear Information System (INIS)

Deeney, C.; LePell, P.D.; Failor, B.H.; Wong, S.L.; Apruzese, J.P.; Whitney, K.G.; Thornhill, J.W.; Davis, J.; Yadlowsky, E.; Hazelton, R.C.; Moschella, J.J.; Nash, T.; Loter, N.

1995-01-01

Magnesium-coated aluminum wire array Z pinch plasmas have been tested on a 4-MA, 6-TW pulsed electrical generator. A mixture of 80% aluminum and 20% magnesium is observed to maximize the radiated kilovolt x-ray yield at ≥50 kJ, which is 50% higher than that obtained with pure aluminum. Spectroscopic analysis and collisional radiative equilbrium models with radiation transport are employed to show that the aluminum-magnesium mixture reduces the opacity of the strongest emission lines, thus increasing the yield by increasing the probability of photon escape. Furthermore, the spectroscopic data also point to the presence of a strong temperature gradient in the pinched plasma that results in the outer magnesium coating of the wires having a higher electron temperature in the pinch. This temperature difference also plays a role in enhancing the kilovolt x-ray yield. The observation of a higher magnesium electron temperature offers evidence that the magnesium reaches the axis first, forming a core that is compressed and heated by the imploding mass of aluminum. Since the emissions from the core are not absorbed by the outer aluminum, the yields are increased. By comparison, aluminum-magnesium alloys imploded on a different but similar generator do not show a temperature difference

A preliminary categorization of end-of-life electrical and electronic equipment as secondary metal resources

International Nuclear Information System (INIS)

Oguchi, Masahiro; Murakami, Shinsuke; Sakanakura, Hirofumi; Kida, Akiko; Kameya, Takashi

2011-01-01

Highlights: → End-of-life electrical and electronic equipment (EEE) as secondary metal resources. → The content and the total amount of metals in specific equipment are both important. → We categorized 21 EEE types from contents and total amounts of various metals. → Important equipment types as secondary resources were listed for each metal kind. → Collectability and possible collection systems of various EEE types were discussed. - Abstract: End-of-life electrical and electronic equipment (EEE) has recently received attention as a secondary source of metals. This study examined characteristics of end-of-life EEE as secondary metal resources to consider efficient collection and metal recovery systems according to the specific metals and types of EEE. We constructed an analogy between natural resource development and metal recovery from end-of-life EEE and found that metal content and total annual amount of metal contained in each type of end-of-life EEE should be considered in secondary resource development, as well as the collectability of the end-of-life products. We then categorized 21 EEE types into five groups and discussed their potential as secondary metal resources. Refrigerators, washing machines, air conditioners, and CRT TVs were evaluated as the most important sources of common metals, and personal computers, mobile phones, and video games were evaluated as the most important sources of precious metals. Several types of small digital equipment were also identified as important sources of precious metals; however, mid-size information and communication technology (ICT) equipment (e.g., printers and fax machines) and audio/video equipment were shown to be more important as a source of a variety of less common metals. The physical collectability of each type of EEE was roughly characterized by unit size and number of end-of-life products generated annually. Current collection systems in Japan were examined and potentially appropriate collection

Introduction of electronic referral from community associated with more timely review by secondary services.

Science.gov (United States)

Warren, J; White, S; Day, K J; Gu, Y; Pollock, M

2011-01-01

Electronic referral (eReferral) from community into public secondary healthcare services was introduced to 30 referring general medical practices and 28 hospital based services in late 2007. To measure the extent of uptake of eReferral and its association with changes in referral processing. Analysis of transactional data from the eReferral message service and the patient information management system of the affected hospital; interview of clinical, operational and management stakeholders. eReferral use rose steadily to 1000 transactions per month in 2008, thereafter showing moderate growth to 1200 per month in 2010. Rate of eReferral from the community in 2010 is estimated at 56% of total referrals to the hospital from general practice, and as 71% of referrals from those having done at least one referral electronically. Referral latency from letter date to hospital triage improves significantly from 2007 to 2009 (psystem usability issues. With eReferrals, a referral's status can be checked, and its content read, by any authorized user at any time. The period of eReferral uptake was associated with significant speed-up in referral processing without changes in staffing levels. The eReferral system provides a foundation for further innovation in the community-secondary interface, such as electronic decision support and shared care planning systems. We observed substantial rapid voluntary uptake of eReferrals associated with faster, more reliable and more transparent referral processing.

Laser-based secondary neutral mass spectroscopy: Useful yield and sensitivity

International Nuclear Information System (INIS)

Young, C.E.; Pellin, M.J.; Calaway, W.F.; Joergensen, B.; Schweitzer, E.L.; Gruen, D.M.

1986-01-01

A variety of problems exist in order to optimally apply resonance ionization spectroscopy (RIS) to the detection of sputtered neutral atoms, however. Several of these problems and their solutions are examined in this paper. First, the possible useful yields obtainable and the dependence of useful yield on various laser parameters for this type of sputtered neutral mass spectrometer (SNMS) are considered. Second, the choice of a mass spectrometer and its effect on the instrumental useful yield is explored in light of the unique ionization region for laser based SNMS. Finally a brief description of noise sources and their effect on the instrumental sensitivity is discussed. 33 refs., 12 figs

Charging of Individual Micron-Size Interstellar/Planetary Dust Grains by Secondary Electron Emissions

Science.gov (United States)

Tankosic, D.; Abbas, M. M.

2012-01-01

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with UV/X-ray radiation, as well as by electron/ion impact. Knowledge of physical and optical properties of individual dust grains is required for understanding of the physical and dynamical processes in space environments and the role of dust in formation of stellar and planetary systems. In this paper, we discuss experimental results on dust charging by electron impact, where low energy electrons are scattered or stick to the dust grains, thereby charging the dust grains negatively, and at sufficiently high energies the incident electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Currently, very limited experimental data are available for charging of individual micron-size dust grains, particularly by low energy electron impact. Available theoretical models based on the Sternglass equation (Sternglass, 1954) are applicable for neutral, planar, and bulk surfaces only. However, charging properties of individual micron-size dust grains are expected to be different from the values measured on bulk materials. Our recent experimental results on individual, positively charged, micron-size lunar dust grains levitated in an electrodynamic balance facility (at NASA-MSFC) indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (e.g. Abbas et al, 2010). Here we discuss the complex nature of SEE charging properties of individual micron-size lunar dust grains and silica microspheres.

Convenient determination of luminescence quantum yield using a combined electronic absorption and emission spectrometer

Energy Technology Data Exchange (ETDEWEB)

Prakash, John; Mishra, Ashok Kumar [Department of Chemistry, Indian Institute of Technology Madras, Chennai 600036 (India)

2016-01-15

It is possible to measure luminescence quantum yield in a facile way, by designing an optical spectrometer capable of obtaining electronic absorption as well as luminescence spectra, with a setup that uses the same light source and detector for both the spectral measurements. Employment of a single light source and single detector enables use of the same correction factor profile for spectral corrections. A suitable instrumental scaling factor is used for adjusting spectral losses.

Secondary electron emission from metals irradiated by 0.4-3 MeV gamma-quanta

International Nuclear Information System (INIS)

Grudskij, M.Ya.; Malyshenkov, A.V.; Smirnov, V.V.

1975-01-01

Experimental and calculational data were considered on the secondary electron emission outgoing from metal targets of an equilibrium thickness irradiated by gamma-quanta fluxes with the energies from 0.4 to 3 MeV. New experimental data are presented. Characteristics of emission were measured by two methods: by magnetic spectrometers with a transverse magnetic field, and by means of an electrometric device with using radioisotopic gamma-sources of 198 Au, 137 Cs, 60 Co and 24 Na. The dependence of the electron emission on the atomic number of the target material was studied. For this purpose the parameters of emissions outgoing from Al-, Cu-, Cd-, Pb- and Au-targets were measured. The advantages and shortcomings of the known methods of calculating the second electron emission were discussed. The obtained experimental and calculational results on studying electrons were compared with those known from literature, and possible sources of systematic errors were discussed

Projectile- and charge-state-dependent electron yields from ion penetration of solids as a probe of preequilibrium stopping power

DEFF Research Database (Denmark)

Rothard, H.; Schou, Jørgen; Groeneveld, K.-O.

1992-01-01

Kinetic electron-emission yields gamma from swift ion penetration of solids are proportional to the (electronic) stopping power gamma approximately Beta-S*, if the preequilibrium evolution of the charge and excitation states of the positively charged ions is taken into account. We show...... by investigating the "transport factor" beta, the energy spectrum of directly ejected recoil electrons and the evolution of ionic charge state inside solids. Estimates of the energy-loss fraction leading to electron emission and the effective charges of the ions near the surface allow a quantitative description...

Disparity of secondary electron emission in ferroelectric domains of YMnO{sub 3}

Energy Technology Data Exchange (ETDEWEB)

Cheng, Shaobo; Deng, S. Q.; Yuan, Wenjuan; Yan, Yunjie; Zhu, Jing, E-mail: jzhu@tsinghua.edu.cn [National Center for Electron Microscopy in Beijing, School of Materials Science and Engineering, The State Key Laboratory of Ceramics and Fine Processing, Key Laboratory of Advanced Materials (MOE), Tsinghua University, Beijing 100084 (China); Li, J.; Li, J. Q. [Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)

2015-07-20

The applications of multiferroic materials require our understanding about the behaviors of domains with different polarization directions. Taking advantage of the scanning electron microscope, we investigate the polar surface of single crystal YMnO{sub 3} sample in secondary electron (SE) mode. By slowing down the scanning speed of electron beam, the negative surface potential of YMnO{sub 3} can be realized, and the domain contrast can be correspondingly changed. Under this experimental condition, with the help of a homemade Faraday cup, the difference of intrinsic SE emission coefficients of antiparallel domains is measured to be 0.12 and the downward polarization domains show a larger SE emission ability. Our results indicate that the total SE emission of this material can be altered by changing the ratio of the antiparallel domains, which provide an avenue for device design with this kind of materials.

Correlation between resistance-change effect in transition-metal oxides and secondary-electron contrast of scanning electron microscope images

International Nuclear Information System (INIS)

Kinoshita, K.; Kishida, S.; Yoda, T.

2011-01-01

Conductive atomic-force microscopy (C-AFM) writing is attracting attention as a technique for clarifying the switching mechanism of resistive random-access memory by providing a wide area filled with filaments, which can be regarded as one filament with large radius. The writing area on a nickel-oxide (NiO) film formed by conductive atomic-force microscopy was observed by scanning electron microscope, and a correlation between the contrast in a secondary-electron image (SEI) and the resistance written by C-AFM was revealed. In addition, the dependence of the SEI contrast on the beam accelerating voltage (V accel ) suggests that the resistance-change effect occurs near the surface of the NiO film. As for the effects of electron irradiation and vacuum annealing on the C-AFM writing area, it was shown that the resistance-change effect is caused by exchange of oxygen with the atmosphere at the surface of the NiO film. This result suggests that the low-resistance and high-resistance areas are, respectively, p-type Ni 1+δ O (δ 1+δ O (δ≥ 0).

Global modeling of secondary organic aerosol formation from aromatic hydrocarbons: high- vs. low-yield pathways

Directory of Open Access Journals (Sweden)

D. K. Henze

2008-05-01

Full Text Available Formation of SOA from the aromatic species toluene, xylene, and, for the first time, benzene, is added to a global chemical transport model. A simple mechanism is presented that accounts for competition between low and high-yield pathways of SOA formation, wherein secondary gas-phase products react further with either nitric oxide (NO or hydroperoxy radical (HO₂ to yield semi- or non-volatile products, respectively. Aromatic species yield more SOA when they react with OH in regions where the [NO]/[HO₂] ratios are lower. The SOA yield thus depends upon the distribution of aromatic emissions, with biomass burning emissions being in areas with lower [NO]/[HO₂] ratios, and the reactivity of the aromatic with respect to OH, as a lower initial reactivity allows transport away from industrial source regions, where [NO]/[HO₂] ratios are higher, to more remote regions, where this ratio is lower and, hence, the ultimate yield of SOA is higher. As a result, benzene is estimated to be the most important aromatic species with regards to global formation of SOA, with a total production nearly equal that of toluene and xylene combined. Global production of SOA from aromatic sources via the mechanisms identified here is estimated at 3.5 Tg/yr, resulting in a global burden of 0.08 Tg, twice as large as previous estimates. The contribution of these largely anthropogenic sources to global SOA is still small relative to biogenic sources, which are estimated to comprise 90% of the global SOA burden, about half of which comes from isoprene. Uncertainty in these estimates owing to factors ranging from the atmospheric relevance of chamber conditions to model deficiencies result in an estimated range of SOA production from aromatics of 2–12 Tg/yr. Though this uncertainty range affords a significant anthropogenic contribution to global SOA, it is evident from comparisons to recent observations that additional pathways for

Measurements of the electron cloud in the APS storage ring

International Nuclear Information System (INIS)

Harkey, K. C.

1999-01-01

Synchrotron radiation interacting with the vacuum chamber walls in a storage ring produce photoelectrons that can be accelerated by the beam, acquiring sufficient energy to produce secondary electrons in collisions with the walls. If the secondary-electron yield (SEY) coefficient of the wall material is greater than one, as is the case with the aluminum chambers in the Advanced Photon Source (APS) storage ring, a runaway condition can develop. As the electron cloud builds up along a train of stored positron or electron bunches, the possibility exists that a transverse perturbation of the head bunch will be communicated to trailing bunches due to interaction with the cloud. In order to characterize the electron cloud, a special vacuum chamber was built and inserted into the ring. The chamber contains 10 rudimentary electron-energy analyzers, as well as three targets coated with different materials. Measurements show that the intensity and electron energy distribution are highly dependent on the temporal spacing between adjacent bunches and the amount of current contained in each bunch. Furthermore, measurements using the different targets are consistent with what would be expected based on the SEY of the coatings. Data for both positron and electron beams are presented

Time-dependent radiolytic yields at room temperature and temperature-dependent absorption spectra of the solvated electrons in polyols

International Nuclear Information System (INIS)

Lin Mingzhang; Mostafavi, M.; Lampre, I.; Muroya, Y.; Katsumura, Y.

2007-01-01

The molar extinction coefficients at the absorption maximum of the solvated electron spectrum have been evaluated to be 900, 970, and 1000 mol -1 ·m 2 for 1,2-ethanediol (12ED), 1,2-propanediol (12PD), and 1,3-propanediol (13PD), respectively. These values are two-third or three-fourth of the value usually reported in the published report. Picosecond pulse radiolysis studies have aided in depicting the radiolytic yield of the solvated electron in these solvents as a function of time from picosecond to microsecond. The radiolytic yield in these viscous solvents is found to be strongly different from that of the water solution. The temperature dependent absorption spectra of the solvated electron in 12ED, 12PD, and 13PD have been also investigated. In all the three solvents, the optical spectra shift to the red with increasing temperature. While the shape of the spectra does not change in 13PD, a widening on the blue side of the absorption band is observed in 12ED and 12PD at elevated temperatures. (authors)

Study of electron beam effects on surfaces using x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS)

International Nuclear Information System (INIS)

Gettings, M.; Coad, J.P.

1976-02-01

Discrepancies in the surface analyses of oxidised or heavily contaminated materials have been observed between X-ray Photoelectron Spectroscopy (XPS) and techniques using electron beams (primarily Auger Electron Spectroscopy (AES)). These discrepancies can be ascribed to the influence of the primary electron beam and to illustrate the various types of electron effects different materials were analysed using XPS and Secondary Ion Mass Spectroscopy (SIMS) before and after large area electron bombardment. The materials used included chrome and stainless steels, nickel, platinum, glass and brass. (author)

Plasma-Sheath Instability in Hall Thrusters Due to Periodic Modulation of the Energy of Secondary Electrons in Cyclotron Motion

International Nuclear Information System (INIS)

Sydorenko, D.; Smolyakov, A.; Kaganovich, I.; Raitses, Y.

2008-01-01

Particle-in-cell simulation of Hall thruster plasmas reveals a plasma-sheath instability manifesting itself as a rearrangement of the plasma sheath near the thruster channel walls accompanied by a sudden change of many discharge parameters. The instability develops when the sheath current as a function of the sheath voltage is in the negative conductivity regime. The major part of the sheath current is produced by beams of secondary electrons counter-streaming between the walls. The negative conductivity is the result of nonlinear dependence of beam-induced secondary electron emission on the plasma potential. The intensity of such emission is defined by the beam energy. The energy of the beam in crossed axial electric and radial magnetic fields is a quasi-periodical function of the phase of cyclotron rotation, which depends on the radial profile of the potential and the thruster channel width. There is a discrete set of stability intervals determined by the final phase of the cyclotron rotation of secondary electrons. As a result, a small variation of the thruster channel width may result in abrupt changes of plasma parameters if the plasma state jumps from one stability interval to another

Response of Saturn's ionosphere to solar radiation: Testing parameterizations for thermal electron heating and secondary ionization processes

Science.gov (United States)

Moore, Luke; Galand, Marina; Mueller-Wodarg, Ingo; Mendillo, Michael

2009-12-01

We evaluate the effectiveness of two parameterizations in Saturn's ionosphere over a range of solar fluxes, seasons, and latitudes. First, the parameterization of the thermal electron heating rate, Q* e, introduced in [Moore, L., Galand, M., Mueller-Wodarg, I., Yelle, R.V., Mendillo, M., 2008. Plasma temperatures in Saturn's ionosphere. J. Geophys. Res. 113, A10306. doi:10.1029/2008JA013373.] for one specific set of conditions, is found to produce ion and electron temperatures that agree with self-consistent suprathermal electron calculations to within 2% on average under all conditions considered. Next, we develop a new parameterization of the secondary ion production rate at Saturn based on the calculations of [Galand, M., Moore, L., Mueller-Wodarg, I., Mendillo, M., 2009. Modeling the photoelectron secondary ionization process at Saturn. accepted. J. Geophys. Res.]; it is found to be accurate to within 4% on average. The demonstrated effectiveness of these two parameterizations over a wide range of input conditions makes them good candidates for inclusion in 3D Saturn thermosphere-ionosphere general circulation models (TIGCMs).

Energy-filtered real- and k-space secondary and energy-loss electron imaging with Dual Emission Electron spectro-Microscope: Cs/Mo(110)

Energy Technology Data Exchange (ETDEWEB)

Grzelakowski, Krzysztof P., E-mail: k.grzelakowski@opticon-nanotechnology.com

2016-05-15

Since its introduction the importance of complementary k{sub ||}-space (LEED) and real space (LEEM) information in the investigation of surface science phenomena has been widely demonstrated over the last five decades. In this paper we report the application of a novel kind of electron spectromicroscope Dual Emission Electron spectroMicroscope (DEEM) with two independent electron optical channels for reciprocal and real space quasi-simultaneous imaging in investigation of a Cs covered Mo(110) single crystal by using the 800 eV electron beam from an “in-lens” electron gun system developed for the sample illumination. With the DEEM spectromicroscope it is possible to observe dynamic, irreversible processes at surfaces in the energy-filtered real space and in the corresponding energy-filtered k{sub ǁ}-space quasi-simultaneously in two independent imaging columns. The novel concept of the high energy electron beam sample illumination in the cathode lens based microscopes allows chemically selective imaging and analysis under laboratory conditions. - Highlights: • A novel concept of the electron sample illumination with “in-lens” e- gun is realized. • Quasi-simultaneous energy selective observation of the real- and k-space in EELS mode. • Observation of the energy filtered Auger electron diffraction at Cs atoms on Mo(110). • Energy-loss, Auger and secondary electron momentum microscopy is realized.

LUNAR DUST GRAIN CHARGING BY ELECTRON IMPACT: COMPLEX ROLE OF SECONDARY ELECTRON EMISSIONS IN SPACE ENVIRONMENTS

International Nuclear Information System (INIS)

Abbas, M. M.; Craven, P. D.; LeClair, A. C.; Spann, J. F.; Tankosic, D.

2010-01-01

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with radiation from nearby sources, or by electron/ion collisions by sticking or secondary electron emissions (SEEs). The high vacuum environment on the lunar surface leads to some unusual physical and dynamical phenomena involving dust grains with high adhesive characteristics, and levitation and transportation over long distances. Knowledge of the dust grain charges and equilibrium potentials is important for understanding a variety of physical and dynamical processes in the interstellar medium, and heliospheric, interplanetary/planetary, and lunar environments. It has been well recognized that the charging properties of individual micron-/submicron-size dust grains are expected to be substantially different from the corresponding values for bulk materials. In this paper, we present experimental results on the charging of individual 0.2-13 μm size dust grains selected from Apollo 11 and 17 dust samples, and spherical silica particles by exposing them to mono-energetic electron beams in the 10-200 eV energy range. The dust charging process by electron impact involving the SEEs discussed is found to be a complex charging phenomenon with strong particle size dependence. The measurements indicate substantial differences between the polarity and magnitude of the dust charging rates of individual small-size dust grains, and the measurements and model properties of corresponding bulk materials. A more comprehensive plan of measurements of the charging properties of individual dust grains for developing a database for realistic models of dust charging in astrophysical and lunar environments is in progress.

Lunary Dust Grain Charging by Electron Impact: Complex Role of Secondary Electron Emissions in Space Environments

Science.gov (United States)

Abbas, M. M.; Tankosic, D.; Crave, P. D.; LeClair, A.; Spann, J. F.

2010-01-01

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with radiation from nearby sources, or by electron/ion collisions by sticking or secondary electron emissions (SEES). The high vacuum environment on the lunar surface leads to some unusual physical and dynamical phenomena involving dust grains with high adhesive characteristics, and levitation and transportation over long distances. Knowledge of the dust grain charges and equilibrium potentials is important for understanding a variety of physical and dynamical processes in the interstellar medium, and heliospheric, interplanetary/ planetary, and lunar environments. It has been well recognized that the charging properties of individual micron-/submicron-size dust grains are expected to be substantially different from the corresponding values for bulk materials. In this paper, we present experimental results on the charging of individual 0.2-13 m size dust grains selected from Apollo 11 and 17 dust samples, and spherical silica particles by exposing them to mono-energetic electron beams in the 10-200 eV energy range. The dust charging process by electron impact involving the SEES discussed is found to be a complex charging phenomenon with strong particle size dependence. The measurements indicate substantial differences between the polarity and magnitude of the dust charging rates of individual small-size dust grains, and the measurements and model properties of corresponding bulk materials. A more comprehensive plan of measurements of the charging properties of individual dust grains for developing a database for realistic models of dust charging in astrophysical and lunar environments is in progress.

Mass yields of secondary organic aerosols from the oxidation of α-pinene and real plant emissions

Directory of Open Access Journals (Sweden)

J. N. Smith

2011-02-01

Full Text Available Biogenic volatile organic compounds (VOCs are a significant source of global secondary organic aerosol (SOA; however, quantifying their aerosol forming potential remains a challenge. This study presents smog chamber laboratory work, focusing on SOA formation via oxidation of the emissions of two dominant tree species from boreal forest area, Scots pine (Pinus sylvestris L. and Norway spruce (Picea abies, by hydroxyl radical (OH and ozone (O3. Oxidation of α-pinene was also studied as a reference system. Tetramethylethylene (TME and 2-butanol were added to control OH and O3 levels, thereby allowing SOA formation events to be categorized as resulting from either OH-dominated or O3-initiated chemistry. SOA mass yields from α-pinene are consistent with previous studies while the yields from the real plant emissions are generally lower than that from α-pinene, varying from 1.9% at an aerosol mass loading of 0.69 μg m−3 to 17.7% at 26.0 μg m−3. Mass yields from oxidation of real plant emissions are subject to the interactive effects of the molecular structures of plant emissions and their reaction chemistry with OH and O3, which lead to variations in condensable product volatility. SOA formation can be reproduced with a two-product gas-phase partitioning absorption model in spite of differences in the source of oxidant species and product volatility in the real plant emission experiments. Condensable products from OH-dominated chemistry showed a higher volatility than those from O3-initiated systems during aerosol growth stage. Particulate phase products became less volatile via aging process which continued after input gas-phase oxidants had been completely consumed.

submitter Measurement of LYSO Intrinsic Light Yield Using Electron Excitation

CERN Document Server

Martinez Turtos, Rosana; Pizzichemi, Marco; Ghezzi, Alessio; Pauwels, Kristof; Auffray, Etiennette; Lecoq, Paul; Paganoni, Marco

2016-01-01

The determination of the intrinsic light yield $(LY_{int})$ of scintillating crystals, i.e. number of optical photons created per amount of energy deposited, constitutes a key factor in order to characterize and optimize their energy and time resolution. However, until now measurements of this quantity are affected by large uncertainties and often rely on corrections for bulk absorption and surface/edge state. The novel idea presented in this contribution is based on the confinement of the scintillation emission in the central upper part of a 10 mm cubic crystal using a 1.5 MeV electron beam with diameter of 1 mm. A black non-reflective pinhole aligned with the excitation point is used to fix the light extraction solid angle (narrower than total reflection angle), which then sets a light cone travel path through the crystal. The final number of photoelectrons detected using a Hamamatsu R2059 photomultiplier tube (PMT) was corrected for the extraction solid angle, the Fresnel reflection coefficient and quantum...

Electron-Cloud Build-up in the FNAL Main Injector

International Nuclear Information System (INIS)

Furman, M.A.

2007-01-01

We present a summary on ongoing simulation results for the electron-cloud buildup in the context of the proposed FNAL Main Injector (MI) intensity upgrade [1] in a fieldfree region at the location of the RFA electron detector [2]. By combining our simulated results for the electron flux at the vacuum chamber wall with the corresponding measurements obtained with the RFA we infer that the peak secondary electron yield (SEY) (delta) max is ∼> 1.4, and the average electron density is n e ∼> 10 10 m -3 at transition energy for the specific fill pattern and beam intensities defined below. The sensitivity of our results to several variables remains to be explored in order to reach more definitive results. Effects from the electron cloud on the beam are being investigated separately [3

Effect of the sample annealing temperature and sample crystallographic orientation on the charge kinetics of MgO single crystals subjected to keV electron irradiation.

Science.gov (United States)

Boughariou, A; Damamme, G; Kallel, A

2015-04-01

This paper focuses on the effect of sample annealing temperature and crystallographic orientation on the secondary electron yield of MgO during charging by a defocused electron beam irradiation. The experimental results show that there are two regimes during the charging process that are better identified by plotting the logarithm of the secondary electron emission yield, lnσ, as function of the total trapped charge in the material QT. The impact of the annealing temperature and crystallographic orientation on the evolution of lnσ is presented here. The slope of the asymptotic regime of the curve lnσ as function of QT, expressed in cm(2) per trapped charge, is probably linked to the elementary cross section of electron-hole recombination, σhole, which controls the trapping evolution in the reach of the stationary flow regime. © 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.

Neutron yield and induced radioactivity: a study of 235-MeV proton and 3-GeV electron accelerators

International Nuclear Information System (INIS)

Hsu, Yung-Cheng; Lai, Bo-Lun; Sheu, Rong-Jiun

2016-01-01

This study evaluated the magnitude of potential neutron yield and induced radioactivity of two new accelerators in Taiwan: a 235-MeV proton cyclotron for radiation therapy and a 3-GeV electron synchrotron serving as the injector for the Taiwan Photon Source. From a nuclear interaction point of view, neutron production from targets bombarded with high-energy particles is intrinsically related to the resulting target activation. Two multi-particle interaction and transport codes, FLUKA and MCNPX, were used in this study. To ensure prediction quality, much effort was devoted to the associated benchmark calculations. Comparisons of the accelerators' results for three target materials (copper, stainless steel and tissue) are presented. Although the proton-induced neutron yields were higher than those induced by electrons, the maximal neutron production rates of both accelerators were comparable according to their respective beam outputs during typical operation. Activation products in the targets of the two accelerators were unexpectedly similar because the primary reaction channels for proton- and electron-induced activation are (p,pn) and (γ,n), respectively. The resulting residual activities and remnant dose rates as a function of time were examined and discussed. (authors)

Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

International Nuclear Information System (INIS)

Wright, R.B.; Gruen, D.M.

1980-01-01

Secondary photon and secondary ion emission during energetic particle irradiation of solid surfaces is assumed to arise due to excitation and de-excitation of sputtered particles originating from a collision cascade induced by the incident projectile. The excitation is postulated to occur by two alternative mechanisms: path (a), where excitation occurs at or very near the surface of the solid due to atom--atom or atom--electron collisions; and path (b), where excitation occurs as the sputtered particle leaves the solid, but is still under its influence so that electron exchange processes are permitted. Once the excited and/or ionized sputtered particle is formed nonradiative de-excitation processes are then included in the discussion which allow the excited and/or ionized particle to be de-excited and/or neutralized. The result of these nonradiative de-excitation processes is shown to provide a possible channel for the formation of new excited ''daughters'' by the de-excitation of the initial excited ''parent''. Depending on the initial excitation probability of the parent the new excited daughters are shown to contribute to various energy regions of the excited and/or ionized secondary particle energy distribution. A mathematical formalism is developed based on the neutral sputtered atom energy and velocity distributions assuming a collision cascade origin for these sputtered particles. By including various models for the excitation probability, and the survival probability for excited particles once formed to not undergo nonradiative de-excitation the resulting energy and velocity distributions of the sputtered excited and/or ionized secondary particles are calculated. These distributions are found to be a function of the emission angle depending on the model assumed for the initial excitation. From this formalism the total excited secondary particle yield may be calculated

Surface behavior based on ion-induced secondary electron emission from semi-insulating materials in breakdown evolution

Energy Technology Data Exchange (ETDEWEB)

Koc, Emrah; Karakoese, Sema [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Salamov, Bahtiyar G. [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Institute of Physics, National Academy of Science, 1143 Baku (Azerbaijan)

2013-09-15

This study focuses on analyses of secondary electron emission (SEE) at semiconductor surfaces when the sufficient conditions of space-time distribution occur. Experimental measurements and calculations with the approach of Townsend coefficients, which include the evaluations of ionization coefficient ({alpha}) and SEE coefficient ({gamma}) were performed in high-ohmic InP, GaAs, and Si semiconductor cathodes with argon and air environments in a wide range of E/N (300-10 000 Td). The direct calculations of {gamma} were carried out to determine the behavior of cold-semiconductor cathode current in a wide range of microgaps (45-525 {mu}m). Paschen curves are interpreted in the dependence of large pd range on breakdown voltage through {gamma} and {alpha}/N. Ion-induced secondary electrons exhibit the direct behaviors affecting the timescale of breakdown evolution in the vicinity of the Paschen minimum during the natural bombardment process with ions of semiconductor cathodes. Also, when {alpha}/N rapidly drops and the excitations of gas atoms densely occupy the gas volume, we determined that the photoelectric effect provides a growth for electron emission from semiconductor surfaces at the breakdown stage at the reduced values of E/N. At all pressures, the emission magnitudes of electrons liberated by semiconductor cathodes into vacuum are found as {gamma}{sub InP} > {gamma}{sub GaAs} > {gamma}{sub Si} in breakdown evolution. (copyright 2013 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Energy- and temperature dependences of secondary electron emission of CsI- and CsBr layers doped with Cd

International Nuclear Information System (INIS)

Galij, P.V.; Tsal', N.A.

1983-01-01

The energy and temperature dependences of the secondary electron emission coefficient (SEEC) of CsI-Cd-, CsBr-Cd-, CsI-CsBr layers have been studied. The effect of bivalent cadmium impurity on the SEEC value is investigated. It is shown that implantation of small amounts of Cd 2+ impurity into the lattice of the initial monocrystals might increase the SEEC values of the layers. Temperature dependences (TD) of SEEC are measured and the possibility of comparing experimental results with the Dekker formula is analyzed. A conclusion is drawn that the Dekker model well describes the TD of SEEC of doped layers at temperatures T < or approximately 100 deg C. At elevated temperatures., along with secondary electron scattering on phonons, one should take into account their scattering on vacancies

Net current measurements and secondary electron emission characteristics of the Voyager plasma science experiment and their impact on data interpretation

Science.gov (United States)

Mcnutt, Ralph L., Jr.

1988-01-01

The Voyager Plasma Science (PLS) instrument is capable of returning integral (DC) current measurements, similar in some respects to measurements made with a Langmuir probe or a retarding potential analyzer, although there are significant differences. The integral measurements were made during a calibration sequence in the solar wind, during Cruise Science Maneuvers, and within the magnetospheres of Jupiter and Saturn by Voyager 1. After the failure of the PLS experiment following the Saturn encounter, that instrument was placed in the DC return mode returning possibly usable data from early 1981 through early 1985. The DC return measurements are difficult to interpret and are above threshold values only for relatively large fluxes; the determination of the measured current level is dependent on the operating temperature of the preamplifiers which further complicates the interpretation. Nevertheless, these measurements can be used to determine the efficiency of the suppressor grid at preventing the loss of secondary electrons off the collector plate. Some DC return measurements have been invaluable in aiding in the interpretation of some electron plasma measurements not previously understood. It is found that electron spectra can be significantly modified by the presence of second generation secondary electrons produced by either first generation secondaries or photoelectrons on the support ring of the negative high voltage modulator grid within the instrument housing.

Comparison of gamma ray and electron beam irradiation on extraction yield, morphological and antioxidant properties of polysaccharides from tamarind seed

Energy Technology Data Exchange (ETDEWEB)

Choi, Jong-il [Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup 580-185 (Korea, Republic of); Kim, Jae-Kyung [Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup 580-185 (Korea, Republic of); Graduate school of Food and Biotechnology, Korea University, Seoul 146-701 (Korea, Republic of); Srinivasan, Periasamy; Kim, Jae-Hun [Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup 580-185 (Korea, Republic of); Park, Hyun-Jin [Graduate school of Food and Biotechnology, Korea University, Seoul 146-701 (Korea, Republic of); Byun, Myung-Woo [Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup 580-185 (Korea, Republic of); Lee, Ju-Woon [Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup 580-185 (Korea, Republic of)], E-mail: sjwlee@kaeri.re.kr

2009-07-15

Tamarind (Tamarindus indica L) seed polysaccharide (TSP) is of great important due to its various biological activities. The present investigation was carried out to compare extraction yield, morphological characteristics, average molecular weights and antioxidant activities of TSP from gamma- and electron beam (EB)-irradiated tamarind kernel powder. The tamarind kernel powder was irradiated with 0, 5 and 10 kGy by gamma ray (GR) and electron beam, respectively. The extraction yield of TSP was increased significantly by EB and GR irradiation, but there was no significant difference between irradiation types. Morphological studies by scanning electron microscope showed that TSP from GR-irradiated tamarind seed had a fibrous structure, different from that of EB irradiated with a particle structures. The average molecular weight of TSP was decreased by the irradiation, and EB treatment degraded more severely than GR. Superoxide radical scavenging ability and total antioxidant capacity of EB-treated TSP showed higher than those of GR-treated TSP.

Secondary electron ion source neutron generator

Science.gov (United States)

Brainard, John P.; McCollister, Daryl R.

1998-01-01

A neutron generator employing an electron emitter, an ion source bombarded by the electrons from the electron emitter, a plasma containment zone, and a target situated between the plasma containment zone and the electron emitter. The target contains occluded deuterium, tritium, or a mixture thereof

Monte Carlo simulation of kinetic electron emission from metal due to impact of heavy ions

International Nuclear Information System (INIS)

Kawata, J.; Ohya, K.

1999-01-01

A Monte Carlo simulation is performed for study of the dependence of kinetic electron emission on nuclear charge of projectile Z 1 , using the nonlinear response theory with the density-functional (DF) formalism to calculate electron excitation cross section. The kinetic yield, energy distribution, excitation depth distribution and emission statistics of emitted electrons showed clear Z 1 oscillations, however, the Z 1 oscillations of them are different from that of the inelastic stopping power, in particular for high Z 1 , due to large elastic energy loss of the ions and secondary cascade process of primary excited electrons within the solid. For high Z 1 , the linear relationship does not exist between them and the inelastic stopping power, although they are closely related to it. The emission of high-energy primary electrons excited by the ion within shallow depth without experiencing the secondary cascade process, results in the Z 1 dependence in the energy distribution, excitation depth distribution and emission statistics of emitted electrons

An ontology-based method for secondary use of electronic dental record data

Science.gov (United States)

Schleyer, Titus KL; Ruttenberg, Alan; Duncan, William; Haendel, Melissa; Torniai, Carlo; Acharya, Amit; Song, Mei; Thyvalikakath, Thankam P.; Liu, Kaihong; Hernandez, Pedro

A key question for healthcare is how to operationalize the vision of the Learning Healthcare System, in which electronic health record data become a continuous information source for quality assurance and research. This project presents an initial, ontology-based, method for secondary use of electronic dental record (EDR) data. We defined a set of dental clinical research questions; constructed the Oral Health and Disease Ontology (OHD); analyzed data from a commercial EDR database; and created a knowledge base, with the OHD used to represent clinical data about 4,500 patients from a single dental practice. Currently, the OHD includes 213 classes and reuses 1,658 classes from other ontologies. We have developed an initial set of SPARQL queries to allow extraction of data about patients, teeth, surfaces, restorations and findings. Further work will establish a complete, open and reproducible workflow for extracting and aggregating data from a variety of EDRs for research and quality assurance. PMID:24303273

An ontology-based method for secondary use of electronic dental record data.

Science.gov (United States)

Schleyer, Titus Kl; Ruttenberg, Alan; Duncan, William; Haendel, Melissa; Torniai, Carlo; Acharya, Amit; Song, Mei; Thyvalikakath, Thankam P; Liu, Kaihong; Hernandez, Pedro

2013-01-01

A key question for healthcare is how to operationalize the vision of the Learning Healthcare System, in which electronic health record data become a continuous information source for quality assurance and research. This project presents an initial, ontology-based, method for secondary use of electronic dental record (EDR) data. We defined a set of dental clinical research questions; constructed the Oral Health and Disease Ontology (OHD); analyzed data from a commercial EDR database; and created a knowledge base, with the OHD used to represent clinical data about 4,500 patients from a single dental practice. Currently, the OHD includes 213 classes and reuses 1,658 classes from other ontologies. We have developed an initial set of SPARQL queries to allow extraction of data about patients, teeth, surfaces, restorations and findings. Further work will establish a complete, open and reproducible workflow for extracting and aggregating data from a variety of EDRs for research and quality assurance.

Secondary amine-initiated three-component synthesis of 3,4-dihydropyrimidinones and thiones involving alkynes, aldehydes and thiourea/urea

Directory of Open Access Journals (Sweden)

Jie-Ping Wan

2014-01-01

Full Text Available The three-component reactions of aldehydes, electron deficient alkynes and ureas/thioureas have been smoothly performed to yield a class of unprecedented 3,4-dihydropyrimidinones and thiones (DHPMs. The reactions are initiated by the key transformation of an enamine-type activation involving the addition of a secondary amine to an alkyne, which enables the subsequent incorporation of aldehydes and ureas/thioureas. This protocol tolerates a broad range of aryl- or alkylaldehydes, N-substituted and unsubstituted ureas/thioureas and alkynes to yield the corresponding DHPMs with specific regioselectivity.

Theory and measurement of the electron cloud effect

International Nuclear Information System (INIS)

Harkey, K. C.

1999-01-01

Photoelectrons produced through the interaction of synchrotrons radiation and the vacuum chamber walls can be accelerated by a charged particle beam, acquiring sufficient energy to produce secondary electrons (SES) in collisions with the walls. If the secondary-electron yield (SEY) coefficient of the wall material is greater than one, a run-away condition can develop. In addition to the SEY, the degree of amplification depends on the beam intensity and temporal distribution. As the electron cloud builds up along a train of stored bunches, a transverse perturbation of the head bunch can be communicated to trailing bunches in a wakefield-like interaction with the cloud. The electron cloud effect is especially of concern for the high-intensity PEP-II (SLAC) and KEK B-factories and at the Large Hadron Collider (LHC) at CERN. An initiative was undertaken at the Advanced Photon Source (APS) storage ring to characterize the electron cloud in order to provide realistic limits on critical input parameters in the models and improve their predictive capabilities. An intensive research program was undertaken at CERN to address key issues relating to the LHC. After giving an overview, the recent theoretical and experimental results from the APS and the other laboratories will be discussed

Nanopillar arrays on semiconductor membranes as electron emission amplifiers.

Science.gov (United States)

Qin, Hua; Kim, Hyun-Seok; Blick, Robert H

2008-03-05

A new transmission-type electron multiplier was fabricated from silicon-on-insulator (SOI) material by integrating an array of one-dimensional (1D) silicon nanopillars onto a two-dimensional (2D) silicon membrane. Primary electrons are injected into the nanopillar-membrane (NPM) system from the flat surface of the membrane, while electron emission from the nanopillars is probed by an anode. The secondary electron yield (SEY) from the nanopillars in the current device is found to be about 1.8 times that of the plain silicon membrane. This gain in electron number is slightly enhanced by the electric field applied from the anode. Further optimization of the dimensions of the NPM and an application of field emission promise an even higher gain for detector applications and allow for probing of electronic/mechanical excitations in an NPM system stimulated by incident particles or radiation.

The influence of secondary electron emission on the floating potential of tokamak-born dust

International Nuclear Information System (INIS)

Vaverka, J; Richterová, I; Vyšinka, M; Pavlů, J; Šafránková, J; Němeček, Z

2014-01-01

Dust production and its transport into the core plasma is an important issue for magnetic confinement fusion. Dust grains are charged by various processes, such as the collection of plasma particles and electron emissions, and their charge influences the dynamics of the dust. This paper presents the results of calculations of the surface potential of dust grains in a Maxwellian plasma. Our calculations include the charging balance of a secondary electron emission (SEE) from the dust. The numerical model that we have used accounts for the influence of backscattered electrons and takes into account the effects of grain size, material, and it is also able to handle both spherical and non-spherical grains. We discuss the role of the SEE under tokamak conditions and show that the SEE is a leading process for the grains crossing the scrape-off layer from the edge to core plasma. The results of our calculations are relevant for materials related to fusion experiments in ITER. (paper)

Electron transfer reactions induced by the triplet state of thiacarbocyanine dimers

International Nuclear Information System (INIS)

Chibisov, Alexander K.; Slavnova, Tatyana D.; Goerner, Helmut

2004-01-01

The photoinduced electron transfer between either cationic 5,5 ' -dichloro-3,3 ' ,9-triethylthiacarbocyanine (1) or a structurally similar anionic dye (2) and appropriate donors, e.g. ascorbic acid, and acceptors, e.g. methyl viologen, was studied by ns-laser photolysis. In aqueous solution the dyes in the ground state are present as an equilibrated mixture of dimers and monomers, whereas the triplet state is mainly populated from dimers. The triplet states of both dimers and monomers are quenched by electron donors or acceptors and the rate constant for quenching is generally 2-4 times higher for dimers than for monomers. The kinetics of triplet decay and radical formation and decay as a result of primary and secondary electron transfer were analyzed. While the one-electron reduced dimer decays due to back reactions, the one-electron oxidized dimer rapidly dissociates into the monomer and the monomeric dye radical. For the dimeric dye/donor/acceptor systems the primary photoinduced electron transfer occurs either from the donor or to the acceptor yielding the dimeric dye radicals. The one-electron reduced dimer can be efficiently oxidized by acceptors, e.g. the rate constant for reaction of the dimeric dye radical of 1 with methyl viologen (photoreductive pathway of sensitization) is 1.6x10 9 M -1 s -1 . The photooxidative pathway of sensitization is more complicated; after dissociation of the dimeric dye radical, the monomeric dye radical is reduced in a secondary electron transfer from ascorbic acid, e.g. with a rate constant of 1x10 9 M -1 s -1 for 2, yielding the monomer. On increasing the donor concentration the photooxidative pathway of sensitization is switched to a photoreductive one

Local conditions for the Pauli potential in order to yield self-consistent electron densities exhibiting proper atomic shell structure

Energy Technology Data Exchange (ETDEWEB)

Finzel, Kati, E-mail: kati.finzel@liu.se [Linköpings University, IFM Department of Physics, 58183 Linköping (Sweden)

2016-01-21

The local conditions for the Pauli potential that are necessary in order to yield self-consistent electron densities from orbital-free calculations are investigated for approximations that are expressed with the help of a local position variable. It is shown that those local conditions also apply when the Pauli potential is given in terms of the electron density. An explicit formula for the Ne atom is given, preserving the local conditions during the iterative procedure. The resulting orbital-free electron density exhibits proper shell structure behavior and is in close agreement with the Kohn-Sham electron density. This study demonstrates that it is possible to obtain self-consistent orbital-free electron densities with proper atomic shell structure from simple one-point approximations for the Pauli potential at local density level.

Single-side electron multipacting at the photocathode in rf guns

Directory of Open Access Journals (Sweden)

Jang-Hui Han

2008-01-01

Full Text Available Multiple electron impacting (multipacting can take place in rf fields when the rf components are composed of materials with a secondary electron yield greater than one. In rf gun cavities, multipacting may change the properties of the vacuum components or even damage them. First systematic measurements of the multipacting occurring in a photocathode rf gun were made at the Fermilab/NICADD Photoinjector Laboratory in 2000. The multipacting properties were found to depend on the cathode material and the solenoid field configuration. In this study, we measure the multipacting properties in more detail and model the secondary electron generation for numerical simulation. Measurements and simulations for the photoinjectors at Fermilab and DESY are compared. The multipacting takes place at the photocathode in rf guns and is categorized as single-side multipacting. In a low rf field, the electrons emitted from the cathode area do not leave the gun cavity within one rf cycle and have an opportunity to travel back and hit the cathode. The solenoid field distribution in the vicinity of the cathode changes the probability of electron bombardment of the cathode and makes a major contribution to the multipacting behavior.

Neutron yield and induced radioactivity: a study of 235-MeV proton and 3-GeV electron accelerators.

Science.gov (United States)

Hsu, Yung-Cheng; Lai, Bo-Lun; Sheu, Rong-Jiun

2016-01-01

This study evaluated the magnitude of potential neutron yield and induced radioactivity of two new accelerators in Taiwan: a 235-MeV proton cyclotron for radiation therapy and a 3-GeV electron synchrotron serving as the injector for the Taiwan Photon Source. From a nuclear interaction point of view, neutron production from targets bombarded with high-energy particles is intrinsically related to the resulting target activation. Two multi-particle interaction and transport codes, FLUKA and MCNPX, were used in this study. To ensure prediction quality, much effort was devoted to the associated benchmark calculations. Comparisons of the accelerators' results for three target materials (copper, stainless steel and tissue) are presented. Although the proton-induced neutron yields were higher than those induced by electrons, the maximal neutron production rates of both accelerators were comparable according to their respective beam outputs during typical operation. Activation products in the targets of the two accelerators were unexpectedly similar because the primary reaction channels for proton- and electron-induced activation are (p,pn) and (γ,n), respectively. The resulting residual activities and remnant dose rates as a function of time were examined and discussed. © The Author 2015. Published by Oxford University Press. All rights reserved. For Permissions, please email: journals.permissions@oup.com.

Photo-triggering and secondary electron produced ionization in electric discharge ArF* excimer lasers

Science.gov (United States)

Xiong, Zhongmin; Kushner, Mark J.

2011-10-01

Electric discharge excimer lasers are sustained in multi-atmosphere attaching gas mixtures that are typically preionized to enable a reproducible, uniform glow, which maximizes optical quality and gain. This preionization is often accomplished using UV light produced by a corona discharge within the plasma cavity. To quantify the relationship between corona discharge properties and those of the laser discharge, the triggering of electron avalanche by preionizing UV light in an electric discharge-pumped ArF* excimer laser was numerically investigated using a two-dimensional model. The preionizing UV fluxes were generated by a corona-bar discharge driven by the same voltage pulse as the main discharge sustained in a multi-atmospheric Ne/Ar/Xe/F2 gas mixture. The resulting peak photo-electron density in the inter-electrode spacing is around 108 cm-3, and its distribution is biased toward the UV source. The preionization density increases with increasing dielectric constant and capacitance of the corona bar. The symmetry and uniformity of the discharge are, however, improved significantly once the main avalanche develops. In addition to bulk electron impact ionization, the ionization generated by sheath accelerated secondary electrons was found to be important in sustaining the discharge current at experimentally observed values. At peak current, the magnitude of the ionization by sheath accelerated electrons is comparable to that from bulk electron impact in the vicinity of the cathode.

Excited-atom production by electron and ion bombardment of alkali halides

International Nuclear Information System (INIS)

Walkup, R.E.; Avouris, P.; Ghosh, A.P.

1987-01-01

We present experimental results on the production of excited atoms by electron and ion bombardment of alkali halides. For the case of electron bombardment, Doppler shift measurements show that the electronically excited atoms have a thermal velocity distribution in equilibrium with the surface temperature. Measurements of the absolute yield of excited atoms, the distribution of population among the excited states, and the systematic dependence on incident electron current and sample temperature support a model in which the excited atoms are produced by gas-phase collisions between desorbed ground-state atoms and secondary electrons. In contrast, for the case of ion bombardment, the excited atoms are directly sputtered from the surface, with velocity distributions characteristic of a collision cascade, and with typical energies of --10 eV

Improved Electron Yield and Spin-Polarization from III-V Photocathodes via Bias Enhanced Carrier Drift: Final Report

International Nuclear Information System (INIS)

Mulhollan, Gregory A.

2006-01-01

In this DOE STTR program, Saxet Surface Science, with the Stanford Linear Accelerator Center as partner, designed, built and tested photocathode structures such that optimal drift-enhanced spin-polarization from GaAs based photoemitters was achieved with minimal bias supply requirements. The forward bias surface grid composition was optimized for maximum polarization and yield, together with other construction parameters including doping profile. This program has culminated in a cathode bias structure affording increased electron spin polarization when applied to III-V based photocathodes. The optimized bias structure has been incorporated into a cathode mounting and biasing design for use in a polarized electron gun.

Pulse radiolysis study on temperature and pressure dependence of the yield of solvated electron in methanol from room temperature to supercritical condition

International Nuclear Information System (INIS)

Han, Zhenhui; He, Hui; Lin, Mingzhang; Muroya, Yusa; Katsumura, Yosuke

2012-09-01

A new concept of nuclear reactor, supercritical water-cooled reactor (SCWR), has been proposed, which is based on the success of the use of supercritical water (SCW) in fossil fuel power plants for more than three decades. This new concept reactor has advantages of higher thermal conversion efficiency, simplicity in structure, safety, etc, and it has been selected as one of the reactor concepts for the next generation nuclear reactor systems. In these reactors, the same as in boiling water reactors (BWR) and pressurized water reactors (PWR), water is used not only as a coolant but also as a moderator. It is very important to understand the behavior of the radiolysis products of water under the supercritical condition, since the water is exposed to a strong radiation field under very high temperature condition. Usually, in order to predict the concentrations of water decomposition products with carrying out some kinds of computer simulations, knowledge of the temperature and/or pressure dependent G-values (denoting the experimentally measured radiolytic yields) as well as of the rate constants of a set of reactions becomes very important. Therefore, in recent years, two groups from Argonne National Laboratory and The University of Tokyo, simultaneously conducted two projects aimed at obtaining basic data on radiolysis of SCW. However, it is still lack of reliable radiolytic yields of water decomposition products in very high temperature region. As we known, the properties of solvated electrons in polar liquid are very helpful for our understanding how they play a central role in many processes, such as solvation and reducing reactions. The solvated electron can also be used as a probe to determine the dynamic nature of the polar liquid systems. Comparing to water, the primary alcohols have much milder critical points, for example, for water and methanol, the critical temperature and pressure are 374 deg. C and 22.1 MPa and 239.5 deg. C and 8.1 MPa, respectively

Expanding Options. A Model to Attract Secondary Students into Nontraditional Vocational Programs. For Emphasis in: Building Trades, Electronics, Health Services, Machine Shop, Welding.

Science.gov (United States)

Good, James D.; DeVore, Mary Ann

This model has been designed for use by Missouri secondary schools in attracting females and males into nontraditional occupational programs. The research-based strategies are intended for implementation in the following areas: attracting females into building trades, electronics, machine shop, and welding; and males into secondary health…

Vertically etched silicon nano-rods as a sensitive electron detector

International Nuclear Information System (INIS)

Hajmirzaheydarali, M; Akbari, M; Soleimani-Amiri, S; Sadeghipari, M; Shahsafi, A; Akhavan Farahani, A; Mohajerzadeh, S

2015-01-01

We have used vertically etched silicon nano-rods to realize electron detectors suitable for scanning electron microscopes. The results of deep etching of silicon nano-structures are presented to achieve highly ordered arrays of nano-rods. The response of the electron detector to energy of the primary electron beam and the effects of various sizes and materials has been investigated, indicating its high sensitivity to secondary and back-scattered electrons. The miniaturized structure of this electron detector allows it to be placed in the vicinity of the specimen to improve the resolution and contrast. This detector collects electrons and converts the electron current to voltage directly by means of n-doped silicon nano-rods on a p-type silicon substrate. Silicon nano-rods enhance the surface-to-volume ratio of the detector as well as improving the yield of electron detection. The use of nano-structures and silicon nanowires as an electron detector has led to higher sensitivities than with micro-structures. (paper)

Comparison of specular H-atomic-beam intensity and C+ secondary-ion yield at thermally activated decrease of a carbon layer on a Ni(110) surface

International Nuclear Information System (INIS)

Kaarmann, H.; Hoinkes, H.; Wilsch, H.

1983-01-01

The thermally activated disappearance of a carbon layer on a Ni(110) surface was investigated by the scattering of atomic hydrogen and by secondary-ion mass spectrometry. Decreasing C coverage at surface temperatures kept constant in each case at values between 650 and 750 K resulted in an exponential decrease of specular H-beam intensity as well as C + secondary-ion yield. This decrease in both cases fits first-order kinetics (presumable diffusion into the bulk) with an identical rate constant as a function of surface temperature and results finally in a preexponential frequency ν = 10/sup() 10plus-or-minus1/ s -1 and an activation energy E/sub A/ = 1.8 +- 0.2 eV

The Electron-Cloud Effect in the Arcs of the LHC

CERN Document Server

Furman, M A

1998-01-01

We present an update of our estimates for the power deposition arising from the electron-cloud effect in the dipole bending magnets in the arcs of the LHC. In addition, we present the estimate of the power deposition in the field-free regions in the arcs. We hold the number of particles per bunch and the bunch spacing fixed at their nominal values, and we assume throughout a high photon reflectivi ty. We explore the dependence of the power deposition on the photoelectric efficiency and on secondary emission yield parameters. We find a marked sensitivity to parameters that characterize secondary emission on the scale of 5 - 10 eV.

On the e-linac-based neutron yield

International Nuclear Information System (INIS)

Bunatyan, G.G.; Nikolenko, V.G.; Popov, A.B.

2010-01-01

We treat neutron generating in high atomic number materials due to the photonuclear reactions induced by the Bremsstrahlung of an electron beam produced by linear electron accelerator (e-linac). The dependence of neutron yield on the electron energy and the irradiated sample size is considered for various sample materials. The calculations are performed without resort to the so-called 'numerical Monte Carlo simulation'. The acquired neutron yields are well correlated with the data asserted in investigations performed at a number of the e-linac-driven neutron sources

Analogy for Drude's Free Electron Model to Promote Students' Understanding of Electric Circuits in Lower Secondary School

Science.gov (United States)

de Almeida, Maria José B. M.; Salvador, Andreia; Costa, Maria Margarida R. R.

2014-01-01

Aiming at a deep understanding of some basic concepts of electric circuits in lower secondary schools, this work introduces an analogy between the behavior of children playing in a school yard with a central lake, subject to different conditions, rules, and stimuli, and Drude's free electron model of metals. Using this analogy from the first…

Study of the yield of the Fricke dosimetry for electron energies from 2 to 90 MeV

International Nuclear Information System (INIS)

Berkvens, I.P.

1988-01-01

The chemical yield for the ferrous sulphate dosimeters was determined for 60 Co-γ radiation and for electron beams of mean energies in the points of measurements, between 2.7 and about 9 MeV. As references, absolute determinations of absorbed dose based on calorimetric measurements, were used. The irradiation geometry for the ferrous sulphate dosimeter differ always due to technical reasons somewhat from that for the absorber of the calorimeter. The investigators took this difference into account. Perturbation correction factors that correct for the difference in electron scattering in the air gaps around the absorber of the calorimeter and in the graphite, were computed with the Monte Carlo method. Also the ''reference volume method'' recently introduced by the ICRU (report No.35), was applied to correct for the introduction of a ferrous sulphate dosimeter in a graphite phantom. This correction is necessary as the electrons are stopped and scattered in a different way in graphite and water. The results indicated that there is no energy dependence of the chemical yield (G-value) of the dosimeter in the energy range 2.7 to about 9 MeV. A mean G-value of 1,584 (± 0.006) μ mol/J was obtained. For 60 Co-γ a G-value of 1.601 μ mol/J was determined. However, this difference might not be real but due to the present uncertainty in the stopping-power ratios graphite to water. These ratios are thus made use of to determine the G-value from measurements of the absorbed dose to graphite. Previous investigations, by the group from Gent, indicated a small increase of the G-value with the electron energy. These more accurate determinations thus instead indicate a constant G-value. Refs, figs, tabs

Matching Electron Beams Without Secondary Collimation for Treatment of Extensive Recurrent Chest-Wall Carcinoma

International Nuclear Information System (INIS)

Feygelman, Vladimir; Mandelzweig, Yuri; Baral, Ed

2015-01-01

Matching electron beams without secondary collimators (applicators) were used for treatment of extensive, recurrent chest-wall carcinoma. Due to the wide penumbra of such beams, the homogeneity of the dose distribution at and around the junction point is clinically acceptable and relatively insensitive to positional errors. Specifically, dose around the junction point is homogeneous to within ±4% as calculated from beam profiles, while the positional error of 1 cm leaves this number essentially unchanged. The experimental isodose distribution in an anthropomorphic phantom supports this conclusion. Two electron beams with wide penumbra were used to cover the desired treatment area with satisfactory dose homogeneity. The technique is relatively simple yet clinically useful and can be considered a viable alternative for treatment of extensive chest-wall disease. The steps are suggested to make this technique more universal.

Observations of localised dielectric excitations, secondary events and ionisation damage by scanning transmission electron microscopy

International Nuclear Information System (INIS)

Howie, A.

1988-01-01

In the scanning transmission electron microscope (STEM) a high intensity /approximately/0.5nm diameter, probe of 100 keV electrons is formed. This can be positioned to collect energy loss spectra from surfaces, interfaces, small spheres or other particles at controlled values of impact parameter or can be scanned across the object (usually a thin film) to produce high resolution images formed from a variety of signals - small angle or large angle (Z contrast) elastic scattering, inelastic scattering (both valence and core losses), secondary electron emission and x-ray or optical photon emission. The high spatial resolution achievable in a variety of simple structures raises many unsolved theoretical problems concerning the generation, propagation and decay of excitations in inhomogeneous media. These range from quite well posed problems in the mathematical physics of dielectric excitation to problems of plasmon propagation and rather more exotic and less well understood problems of radiation damage. 15 refs., 4 figs

Laboratory study of nitrate photolysis in Antarctic snow. I. Observed quantum yield, domain of photolysis, and secondary chemistry

Energy Technology Data Exchange (ETDEWEB)

Meusinger, Carl; Johnson, Matthew S. [Department of Chemistry, University of Copenhagen, Copenhagen (Denmark); Berhanu, Tesfaye A.; Erbland, Joseph; Savarino, Joel, E-mail: jsavarino@lgge.obs.ujf-grenoble.fr [Univ. Grenoble Alpes, LGGE, F-38000 Grenoble (France); CNRS, LGGE, F-38000 Grenoble (France)

2014-06-28

Post-depositional processes alter nitrate concentration and nitrate isotopic composition in the top layers of snow at sites with low snow accumulation rates, such as Dome C, Antarctica. Available nitrate ice core records can provide input for studying past atmospheres and climate if such processes are understood. It has been shown that photolysis of nitrate in the snowpack plays a major role in nitrate loss and that the photolysis products have a significant influence on the local troposphere as well as on other species in the snow. Reported quantum yields for the main reaction spans orders of magnitude – apparently a result of whether nitrate is located at the air-ice interface or in the ice matrix – constituting the largest uncertainty in models of snowpack NO{sub x} emissions. Here, a laboratory study is presented that uses snow from Dome C and minimizes effects of desorption and recombination by flushing the snow during irradiation with UV light. A selection of UV filters allowed examination of the effects of the 200 and 305 nm absorption bands of nitrate. Nitrate concentration and photon flux were measured in the snow. The quantum yield for loss of nitrate was observed to decrease from 0.44 to 0.003 within what corresponds to days of UV exposure in Antarctica. The superposition of photolysis in two photochemical domains of nitrate in snow is proposed: one of photolabile nitrate, and one of buried nitrate. The difference lies in the ability of reaction products to escape the snow crystal, versus undergoing secondary (recombination) chemistry. Modeled NO{sub x} emissions may increase significantly above measured values due to the observed quantum yield in this study. The apparent quantum yield in the 200 nm band was found to be ∼1%, much lower than reported for aqueous chemistry. A companion paper presents an analysis of the change in isotopic composition of snowpack nitrate based on the same samples as in this study.

Cosmic-Ray Nucleosynthesis of p-nuclei: Yields and Routes

Science.gov (United States)

Kusakabe, Motohiko; Mathews, Grant J.

2018-02-01

We investigate the cosmic-ray nucleosynthesis (CRN) of proton-rich stable nuclides (p-nuclides). We calculate the cosmic-ray (CR) energy spectra of heavy nuclides with mass number A=[74,209], taking into account the detailed nuclear spallation, decay, energy loss, and escape from the Galaxy during the CR propagation. We adopt the latest semiempirical formula SPACS for the spallation cross sections and the latest data on nuclear decay. Effective electron-capture decay rates are calculated using the proper cross sections for recombination and ionization in the whole CR energy region. Calculated CR spectral shapes vary for different nuclides. Abundances of proton-rich unstable nuclides increase in CRs with increasing energy relative to those of other nuclides. Yields of the primary and secondary spallation processes and differential yields from respective seed nuclides are calculated. We find that the CR energy region of ≤slant { \\mathcal O }(100) MeV/nucleon predominantly contributes to the total yields. The atomic cross sections in the low-energy range adopted in this study are then necessary. Effects of CRN on the Galactic chemical evolution of p-nuclides are calculated. Important seed nuclides are identified for respective p-nuclides. The contribution of CRN is significant for 180m Ta, accounting for about 20% of the solar abundance. About 87% of the 180m Ta CRN yield can be attributed to the primary process. The most important production routes are reactions of 181Ta, 180Hf, and 182W. CRN yields of other p-nuclides are typically about { \\mathcal O }(10‑4–10‑2) of solar abundances.

Formulae for the secondary electron yield and total stopping power ...

Indian Academy of Sciences (India)

2Department of Electrical and Biological Physics, Kwangwoon University, 20 Kwangwoon-gil, ..... sample preparation techniques can lead to different ... talline orientation, contamination or submonolayer on the surface of foreign species; a.

Direct detection of neutral metal atoms in electron-stimulated desorption: Al from CH3O/Al(111) - velocity distribution and absolute yield

International Nuclear Information System (INIS)

Whitten, J.E.; Young, C.E.; Pellin, M.J.; Gruen, D.M.; Jones, P.L.

1994-01-01

Electron-stimulated desorption of neutral aluminum from the system CH 3 O/Al(111) has been directly monitored via quasiresonant photoionization with 193 nm excimer laser light and confirmed by two-step resonant ionization, utilizing the Al 3d 2 D manifold. Velocity distribution measurements for the neutral Al peak at ∼ 800 m/s for 1 keV incident electron energy. An absolute yield of 3.2 x 10 -6 Al atoms/electron was determined by comparison with sputtering measurements in the same apparatus. This is the first observation of electron-stimulated metal desorption from adsorbate-covered metallic surfaces

SU-E-T-05: Comparing DNA Strand Break Yields for Photons under Different Irradiation Conditions with Geant4-DNA.

Science.gov (United States)

Pater, P; Bernal, M; Naqa, I El; Seuntjens, J

2012-06-01

To validate and scrutinize published DNA strand break data with Geant4-DNA and a probabilistic model. To study the impact of source size, electronic equilibrium and secondary electron tracking cutoff on direct relative biological effectiveness (DRBE). Geant4 (v4.9.5) was used to simulate a cylindrical region of interest (ROI) with r = 15 nm and length = 1.05 mm, in a slab of liquid water of 1.06 g/cm 3 density. The ROI was irradiated with mono-energetic photons, with a uniformly distributed volumetric isotropic source (0.28, 1.5 keV) or a plane beam (0.662, 1.25 MeV), of variable size. Electrons were tracked down to 50 or 10 eV, with G4-DNA processes and energy transfer greater than 10.79 eV was scored. Based on volume ratios, each scored event had a 0.0388 probability of happening on either DNA helix (break). Clusters of at least one break on each DNA helix within 3.4 nm were found using a DBSCAN algorithm and categorized as double strand breaks (DSB). All other events were categorized as single strand breaks (SSB). Geant4-DNA is able to reproduce strand break yields previously published. Homogeneous irradiation conditions should be present throughout the ROI for DRBE comparisons. SSB yields seem slightly dependent on the primary photon energy. DRBEs show a significant increasing trend for lower energy incident photons. A lower electron cutoff produces higher SSB yields, but decreases the SSB/DSB yields ratio. The probabilistic and geometrical DNA models can predict equivalent results. Using Geant4, we were able to reproduce previously published results on the direct strand break yields of photon and study the importance of irradiation conditions. We also show an ascending trend for DRBE with lower incident photon energies. A probabilistic model coupled with track structure analysis can be used to simulate strand break yields. NSERC, CIHR. © 2012 American Association of Physicists in Medicine.

Direct energy recovery from helium ion beams by a beam direct converter with secondary electron suppressors

International Nuclear Information System (INIS)

Yoshikawa, K.; Yamamoto, Y.; Toku, H.; Kobayashi, A.; Okazaki, T.

1989-01-01

A 5-yr study of beam direct energy conversion was performed at the Kyoto University Institute of Atomic Energy to clarify the essential features of direct energy recovery from monoenergetic ion beams so that the performance characteristics of energy recovery can be predicted reasonably well by numerical calculations. The study used an improved version of an electrostatically electron-suppressed beam direct converter. Secondary electron suppressor grids were added, and a helium ion beam was used with typical parameters of 15.4 keV, 90 mA, and 100 ms. This paper presents a comparison of experimental results with numerical results by the two-dimensional Kyoto University Advanced Dart (KUAD) code, including evaluation of atomic processes

Beam profile measurement of ES-200 using secondary electron emission monitor

Directory of Open Access Journals (Sweden)

E Ebrahimi Basabi

2015-09-01

Full Text Available Up to now, different designs have been introduced for measurement beam profile accelerators. Secondary electron emission monitors (SEM are one of these devices which have been used for this purpose. In this work, a SEM has been constructed to measure beam profile of ES-200 accelerator, a proton electrostatic accelerator which is installed at SBU. Profile grid for both planes designed with 16 wires which are insulated relative to each other. The particles with maximum energy of 200 keV and maximum current of 400 μA are stopped in copper wires. Each of the wires has an individual current-to-voltage amplifier. With a multiplexer, the analogue values are transported to an ADC. The ADCs are read out by a microcontroller and finally profile of beam shows by a user interface program

Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

International Nuclear Information System (INIS)

Lawton, J J; Pulisciano, A; Palmer, R E

2009-01-01

Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (<10 nm). The SEE spectra of graphite, obtained as a function of tip bias voltage, are shown to correspond to unoccupied states in the electronic band structure. The SEE spectra of thin gold films demonstrate the capability of identifying (carbonaceous) surface contamination with this technique.

Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

Energy Technology Data Exchange (ETDEWEB)

Lawton, J J; Pulisciano, A; Palmer, R E, E-mail: R.E.Palmer@bham.ac.u [Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Birmingham B15 2TT (United Kingdom)

2009-11-25

Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip-sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (<10 nm). The SEE spectra of graphite, obtained as a function of tip bias voltage, are shown to correspond to unoccupied states in the electronic band structure. The SEE spectra of thin gold films demonstrate the capability of identifying (carbonaceous) surface contamination with this technique.

Electron Cloud Mitigation in the Spallation Neutron Source Ring

International Nuclear Information System (INIS)

Wei, J.; Blaskiewicz, Michael; Brodowski, J.; Cameron, P.; Davino, Daniele; Fedotov, A.; He, P.; Hseuh, H.; Lee, Y.Y.; Ludewig, H.; Meng, W.; Raparia, D.; Tuozzolo, J.; Zhang, S.Y.; Catalan-Lasheras, N.; Macek, R.J.; Furman, Miguel A.; Aleksandrov, A.; Cousineau, S.; Danilov, V.; Henderson, S.

2008-01-01

The Spallation Neutron Source (SNS) accumulator ring is designed to accumulate, via H - injection, protons of 2 MW beam power at 1 GeV kinetic energy at a repetition rate of 60 Hz [1]. At such beam intensity, electron-cloud is expected to be one of the intensity-limiting mechanisms that complicate ring operations. This paper summarizes mitigation strategy adopted in the design, both in suppressing electron-cloud formation and in enhancing Landau damping, including tapered magnetic field and monitoring system for the collection of stripped electrons at injection, TiN coated beam chamber for suppression of the secondary yield, clearing electrodes dedicated for the injection region and parasitic on BPMs around the ring, solenoid windings in the collimation region, and planning of vacuum systems for beam scrubbing upon operation

Electron-cloud mitigation in the spallation neutron source ring

International Nuclear Information System (INIS)

Wei, J.; Blaskiewicz, M.; Brodowski, J.; Cameron, P.; Davino, D.; Fedotov, A.; He, P.; Hseuh, H.; Lee, Y.Y.; Meng, W.; Raparia, D.; Tuozzolo, J.; Zhang, S.Y.; Danilov, V.; Henderson, S.; Furman, M.; Pivi, M.; Macek, R.

2003-01-01

The Spallation Neutron Source (SNS) accumulator ring is designed to accumulate, via H- injection, protons of 2 MW beam power at 1 GeV kinetic energy at a repetition rate of 60 Hz [1]. At such beam intensity, electron cloud is expected to be one of the intensity-limiting mechanisms that complicate ring operations. This paper summarizes mitigation strategy adopted in the design, both in suppressing electron-cloud formation and in enhancing Landau damping, including tapered magnetic field and monitoring system for the collection of stripped electrons at injection, TiN coated beam chamber for suppression of the secondary yield, clearing electrodes dedicated for the injection region and parasitic on BPMs around the ring, solenoid windings in the collimation region, and planning of vacuum systems for beam scrubbing upon operation

Detector system for particle or quantum radiation with a multitude of channel secondary electron multipliers arranged in the form of a laminar matrix

Energy Technology Data Exchange (ETDEWEB)

Manley, B W; Burgess, H

1979-01-11

The detector system may be used in diagnostic X-ray or gamma radiography. It essentially consists of a great number of channel secondary electron multipliers assigned to which are two electrodes consisting of parallel electrode strips each. The strips in one electrode are some distance away from those of the other electrode and are shifted by 90/sup 0/ with respect to them. Each electrode strip has got a connection joined to a charge detection circuit. This charge detection circuit contains a logic circuit by which a reliable assessment of the surface distribution of the particles resp. quanta hitting the channel secondary electron multipliers is made possible.

Refinement of Monte Carlo simulations of electron-specimen interaction in low-voltage SEM

International Nuclear Information System (INIS)

Kieft, Erik; Bosch, Eric

2008-01-01

A Monte Carlo tool is presented for the simulation of secondary electron (SE) emission in a scanning electron microscope (SEM). The tool is based on the Geant4 platform of CERN. The modularity of this platform makes it comparatively easy to add and test individual physical models. Our aim has been to develop a flexible and generally applicable tool, while at the same time including a good description of low-energy (<50 eV) interactions of electrons with matter. To this end we have combined Mott cross-sections with phonon-scattering based cross-sections for the elastic scattering of electrons, and we have adopted a dielectric function theory approach for inelastic scattering and generation of SEs. A detailed model of the electromagnetic fields from an actual SEM column has been included in the tool for ray tracing of secondary and backscattered electrons. Our models have been validated against experimental results through comparison of the simulation results with experimental yields, SE spectra and SEM images. It is demonstrated that the resulting simulation package is capable of quantitatively predicting experimental SEM images and is an important tool in building a deeper understanding of SEM imaging.

Electron Cloud Simulations of a Proton Storage Ring Using Cold Proton Bunches

International Nuclear Information System (INIS)

Sato, Y.; Holmes, Jeffrey A.; Lee, S.Y.; Macek, R.

2008-01-01

Using the ORBIT code we study the sensitivity of electron cloud properties with respect to different proton beam profiles, the secondary electron yield (SEY) parameter, and the proton loss rate. Our model uses a cold proton bunch to generate primary electrons and electromagnetic field for electron cloud dynamics. We study the dependence of the prompt and swept electron signals vs the bunch charge and the recovery of electron clouds after sweeping on the beam loss rate and the SEY. The simulation results are compared with the experimental data measured at the proton storage ring at the Los Alamos National Laboratory. Our simulations indicate that the fractional proton loss rate in the field-free straight section may be an exponential function of proton beam charge and may also be lower than the averaged fractional proton loss rate over the whole ring.

Genetic analysis and QTL mapping of maize yield and associate ...

African Journals Online (AJOL)

STORAGESEVER

2008-06-17

Jun 17, 2008 ... strongly influenced by both genotype and environment, and the interaction of ... associated with yield components as well as secondary ... QTLs that control grain yield under drought ... statistical analysis (ANOVA etc) of phenotypic traits was carried out .... which means that the loci had stable heredity.

Novel phenomena in clusters irradiated by short-wavelength free-electron lasers

International Nuclear Information System (INIS)

Fukuzawa, Hironobu; Ueda, Kiyoshi

2017-01-01

By electron spectroscopy, we investigated various phenomena that are caused by the irradiation of extreme ultraviolet (EUV) and X-ray free-electron laser (FEL) pulses on rare-gas clusters. The results for the Ne clusters, which were irradiated by EUVFEL pulses at a photon energy of 20.3 eV below the ionization threshold, illustrate that novel interatomic processes yield low-energy electrons. The results for the Xe clusters, irradiated by EUVFEL pulses at a photon energy of 24.3 eV above the threshold, illustrate that nanoplasma is formed as a result of trapping the photoelectrons and consequently emits low-energy thermal electrons. The results for the Ar clusters irradiated by 5 keV XFEL pulses illustrate that nanoplasma is formed by trapping low-energy Auger electrons and secondary electrons in the tens of fs range, and continuous thermal emission from the plasma occurs in the ps range. (author)

A re-evaluation of the initial yield of the hydrated electron in the picosecond time range

International Nuclear Information System (INIS)

Muroya, Yusa; Lin Mingzhang; Wu, Guozhong; Iijima, Hokuto; Yoshii, Koji; Ueda, Toru; Kudo, Hisaaki; Katsumura, Yosuke

2005-01-01

The yield of the hydrated electron in the picosecond time range has been re-evaluated with an ultrafast pulse radiolysis system using a laser photocathode RF-gun in combination with a conventional one, and a value of 4.1±0.2 per 100 eV of absorbed energy at 20 ps was derived. This is consistent with recent experimental results using a time correlation method [Bartels et al., J. Phys. Chem. A 104, 1686-1691 (2000)] and with Monte-Carlo calculations [Muroya et al., Can. J. Chem. 80 1367-1374 (2002)

Molecular Mapping of QTLs for Yield and Yield-Related Traits in Oryza sativa cv Swarna × O. nivara (IRGC81848 Backcross Population

Directory of Open Access Journals (Sweden)

B.P. MALLIKARJUNA SWAMY

2011-09-01

Full Text Available Advanced backcross QTL analysis was used to identify QTLs for seven yield and yield-related traits in a BC2F2 population from the cross between a popular Oryza sativa cv Swarna and O. nivara IRGC81848. Transgressive segregants with more than 15% increased effect over Swarna were observed for all the traits except days to heading and days to 50% flowering. Thirty QTLs were detected for seven yield and yield-related traits using interval and composite interval mapping. Enhancing alleles at 13 (45% of these QTLs were derived from O. nivara, and enhancing alleles at all the QTLs for stem diameter and rachis diameter were derived from O. nivara. Three stem diameter QTLs, two rachis diameter QTLs and one number of secondary branches QTL identified by both Interval and composite interval mapping contributed more than 15% of the total phenotypic variance. The QTL epistasis was significant for stem diameter and plot yield. The most significant QTLs qSD7.2, qSD8.1 and qSD9.1 for stem diameter, qRD9.1 for rachis diameter and qNSB1.1 for number of secondary branches are good targets to evaluate their use in marker-assisted selection. O. nivara is a good source of novel alleles for yield related traits and reveals major effect QTLs suitable for marker-assisted selection.

An experimental study of electron transfer and emission during particle-surface interactions

International Nuclear Information System (INIS)

McGrath, C.T.

2000-09-01

A new coincidence technique has been developed and used to study the secondary electron emission that arises during the interaction of ions with surfaces. This coincidence technique allows the secondary electron emission statistics due to the impact of singly, doubly and multiply charged ions on surfaces to be measured in coincidence with reflected particles, in specific charge states and with specific post-collision trajectories. This system has been used to study the impact of 8 keV H + ions on polycrystalline copper and aluminium targets. Under these conditions the potential emission contribution is negligible and the electron emission is almost entirely due to kinetic emission processes. The sub-surface contribution to the observed electron emission has been isolated using two newly developed models. These models provide valuable information about the depth and amount of surface penetration and on the probability for subsequent electron transport to the surface. The impact of 2 - 100 keV Xe q+ (q = 1 - 10) ions on polycrystalline copper has also been studied using this system. From the subsequent data the potential and kinetic contributions to secondary electron emission have been separated using a previously established model for potential emission. The resulting kinetic emission yield increases with increasing ion impact energy, consistent with current concepts on quasimolecular ionisation. For ions impacting at large incident angles evidence for sub-surface emission has also been observed. The degree of penetration increases with ion impact energy, consistent with current concepts on this effect. The formation of H - ions from incident H + ions has also been studied by measuring the secondary electron emission statistics in coincidence with reflected particles in specific final charge states. This preliminary data is consistent with a two-step process of Auger neutralisation followed by resonant electron capture to the affinity level. However this mechanism

Iridium-Catalyzed Condensation of Primary Amines To Form Secondary Amines

DEFF Research Database (Denmark)

Lorentz-Petersen, Linda Luise Reeh; Jensen, Paw; Madsen, Robert

2009-01-01

Symmetric secondary amines are readily obtained by heating a neat primary amine with 0.5 mol% of bis(dichloro[eta(5)-pentamethylcyclopentadienyl]iridium). The products are isolated by direct distillation in good yields.......Symmetric secondary amines are readily obtained by heating a neat primary amine with 0.5 mol% of bis(dichloro[eta(5)-pentamethylcyclopentadienyl]iridium). The products are isolated by direct distillation in good yields....

Radiological safety aspects of the operation of electron linear accelerators

International Nuclear Information System (INIS)

Swanson, W.P.

1979-01-01

This manual is intended as a guide for the planning and implementation of radiation protection programmes for all types of electron linear accelerators. Material is provided for guidance in the planning and installation stages, as well as for the implementation of radiation protection for continuing operations. Because of their rapidly growing importance, the problems of installation and radiation safety of standard medical and industrial accelerators are discussed in separate sections. Special discussions are devoted to the radiation protection problems unique to electron accelerators: thick-target bremsstrahlung, the electromagnetic cascade, the estimation of secondary-radiation yields from thick targets, and instrumental corrections for accelerator duty factor. In addition, an extensive review of neutron production is given which includes new calculations of neutron production in various materials. A recalculation of activation in a variety of materials has been done for this manual, and specific gamma-ray constants have been recalculated for a number of nuclides to take into account the contribution of K X-rays. The subjects of air and water activation, as well as toxic gas production in air have been specially reviewed. Betatrons and electron microtrons operating at the same energy produce essentially the same kind of secondary radiation as electron linacs and the material given in this manual is directly applicable to them

Rapid synthesis of an electron-deficient t-BuPHOX ligand: cross-coupling of aryl bromides with secondary phosphine oxides

KAUST Repository

McDougal, Nolan T.

2010-10-01

Herein an efficient and direct copper-catalyzed coupling of oxazoline-containing aryl bromides with electron-deficient secondary phosphine oxides is reported. The resulting tertiary phosphine oxides can be reduced to prepare a range of PHOX ligands. The presented strategy is a useful alternative to known methods for constructing PHOX derivatives.

Rapid synthesis of an electron-deficient t-BuPHOX ligand: cross-coupling of aryl bromides with secondary phosphine oxides

KAUST Repository

McDougal, Nolan T.; Streuff, Jan; Mukherjee, Herschel; Virgil, Scott C.; Stoltz, Brian M.

2010-01-01

Herein an efficient and direct copper-catalyzed coupling of oxazoline-containing aryl bromides with electron-deficient secondary phosphine oxides is reported. The resulting tertiary phosphine oxides can be reduced to prepare a range of PHOX ligands. The presented strategy is a useful alternative to known methods for constructing PHOX derivatives.

Evidence for charge exchange effects in electronic excitations in Al by slow singly charged He ions

Energy Technology Data Exchange (ETDEWEB)

Riccardi, P., E-mail: Pierfrancesco.riccardi@fis.unical.it [Dipartimento di Fisica, Università della Calabria and INFN Gruppo collegato di Cosenza, Via P. Bucci cubo 31C, 87036 – Arcavacata di Rende, Cosenza (Italy); Sindona, A. [Dipartimento di Fisica, Università della Calabria and INFN Gruppo collegato di Cosenza, Via P. Bucci cubo 31C, 87036 – Arcavacata di Rende, Cosenza (Italy); Dukes, C.A. [Laboratory for Astrophysics and Surface Physics, Materials Science and Engineering, University of Virginia, Charlottesville, Virginia 22904 (United States)

2016-09-01

We report on experiments of secondary electron emission in the interaction of helium ions with aluminum surfaces. Comparison between the electron emission induced by the impact of {sup 3}He{sup +} and {sup 4}He{sup +} on Al illustrates similarities and differences between the two projectiles. The intensity of emission shows the same dependence on velocity for the two isotopes, showing that KEE yields for helium ions impact on Al are dominated by direct excitation of valence electrons and not by electron promotion. Electron promotion and charge transfer processes are unambiguously identified by the observation of Auger electron emission from Al, at energies below the excitation threshold of Al–Al collisions, indicating energy losses for the projectiles higher than those commonly considered.

LET dependence of scintillation yields in liquid argon

Energy Technology Data Exchange (ETDEWEB)

Doke, Tadayoshi; Hitachi, Akira; Kikuchi, Jun; Crawford, H J; Lindstrom, P J; Masuda, Kimiaki; Shibamura, Eido; Takahashi, Tan

1988-06-01

Scintillation yields (scintillation intensity per unit absorbed energy) in liquid argon for ionizing particles are reviewed as a function of LET for the particles. The maximum scintillation yield, which is obtained for relativistic heavy ions from Ne to La, is about 1.2 times larger than that for gamma rays in NaI(Tl) crystal. In the low LET region, the scintillation yields for relativistic electrons, protons and He ions are 10-20% lower than the maximum yield. This tendency can be explained by taking into account the existence of the electrons which have escaped from their parent ions. In the high LET region, a quenching effect due to high ionization density is observed for alpha particles, fission fragments and relativistic Au ions.