WorldWideScience

Sample records for pixelized tfa sensors

  1. Characterization of Pixel Sensors

    CERN Document Server

    Oliveira, Felipe Ferraz

    2017-01-01

    It was commissioned at CERN ATLAS pixel group a fluorescence setup for characterization of pixel sensors. The idea is to measure the energies of different targets to calibrate your sensor. It was measured four matrices (80, 95, 98 and 106) of the Investigator1 sensor with different deep PW using copper, iron and titanium as target materials. The matrix 80 has a higher gain (0.065 ± 0.002) and matrix 106 has a better energy resolution (0.05 ± 0.04). The noise of the setup is around 3.6 mV .

  2. The ATLAS Silicon Pixel Sensors

    CERN Document Server

    Alam, M S; Einsweiler, K F; Emes, J; Gilchriese, M G D; Joshi, A; Kleinfelder, S A; Marchesini, R; McCormack, F; Milgrome, O; Palaio, N; Pengg, F; Richardson, J; Zizka, G; Ackers, M; Andreazza, A; Comes, G; Fischer, P; Keil, M; Klasen, V; Kühl, T; Meuser, S; Ockenfels, W; Raith, B; Treis, J; Wermes, N; Gössling, C; Hügging, F G; Wüstenfeld, J; Wunstorf, R; Barberis, D; Beccherle, R; Darbo, G; Gagliardi, G; Gemme, C; Morettini, P; Musico, P; Osculati, B; Parodi, F; Rossi, L; Blanquart, L; Breugnon, P; Calvet, D; Clemens, J-C; Delpierre, P A; Hallewell, G D; Laugier, D; Mouthuy, T; Rozanov, A; Valin, I; Aleppo, M; Caccia, M; Ragusa, F; Troncon, C; Lutz, Gerhard; Richter, R H; Rohe, T; Brandl, A; Gorfine, G; Hoeferkamp, M; Seidel, SC; Boyd, GR; Skubic, P L; Sícho, P; Tomasek, L; Vrba, V; Holder, M; Ziolkowski, M; D'Auria, S; del Papa, C; Charles, E; Fasching, D; Becks, K H; Lenzen, G; Linder, C

    2001-01-01

    Prototype sensors for the ATLAS silicon pixel detector have been developed. The design of the sensors is guided by the need to operate them in the severe LHC radiation environment at up to several hundred volts while maintaining a good signal-to-noise ratio, small cell size, and minimal multiple scattering. The ability to be operated under full bias for electrical characterization prior to the attachment of the readout integrated circuit electronics is also desired.

  3. CMOS digital pixel sensors: technology and applications

    Science.gov (United States)

    Skorka, Orit; Joseph, Dileepan

    2014-04-01

    CMOS active pixel sensor technology, which is widely used these days for digital imaging, is based on analog pixels. Transition to digital pixel sensors can boost signal-to-noise ratios and enhance image quality, but can increase pixel area to dimensions that are impractical for the high-volume market of consumer electronic devices. There are two main approaches to digital pixel design. The first uses digitization methods that largely rely on photodetector properties and so are unique to imaging. The second is based on adaptation of a classical analog-to-digital converter (ADC) for in-pixel data conversion. Imaging systems for medical, industrial, and security applications are emerging lower-volume markets that can benefit from these in-pixel ADCs. With these applications, larger pixels are typically acceptable, and imaging may be done in invisible spectral bands.

  4. Advanced pixel architectures for scientific image sensors

    CERN Document Server

    Coath, R; Godbeer, A; Wilson, M; Turchetta, R

    2009-01-01

    We present recent developments from two projects targeting advanced pixel architectures for scientific applications. Results are reported from FORTIS, a sensor demonstrating variants on a 4T pixel architecture. The variants include differences in pixel and diode size, the in-pixel source follower transistor size and the capacitance of the readout node to optimise for low noise and sensitivity to small amounts of charge. Results are also reported from TPAC, a complex pixel architecture with ~160 transistors per pixel. Both sensors were manufactured in the 0.18μm INMAPS process, which includes a special deep p-well layer and fabrication on a high resistivity epitaxial layer for improved charge collection efficiency.

  5. Planar pixel sensors in commercial CMOS technologies

    Energy Technology Data Exchange (ETDEWEB)

    Gonella, Laura; Hemperek, Tomasz; Huegging, Fabian; Krueger, Hans; Wermes, Norbert [Physikalisches Institut der Universitaet Bonn, Nussallee 12, 53115 Bonn (Germany); Macchiolo, Anna [Max-Planck-Institut fuer Physik, Foehringer Ring 6, 80805 Muenchen (Germany)

    2015-07-01

    For the upgrade of the ATLAS experiment at the high luminosity LHC, an all-silicon tracker is foreseen to cope with the increased rate and radiation levels. Pixel and strip detectors will have to cover an area of up to 200m2. To produce modules in high number at reduced costs, new sensor and bonding technologies have to be investigated. Commercial CMOS technologies on high resistive substrates can provide significant advantages in this direction. They offer cost effective, large volume sensor production. In addition to this, production is done on 8'' wafers allowing wafer-to-wafer bonding to the electronics, an interconnection technology substantially cheaper than the bump bonding process used for hybrid pixel detectors at the LHC. Both active and passive n-in-p pixel sensor prototypes have been submitted in a 150 nm CMOS technology on a 2kΩ cm substrate. The passive sensor design will be used to characterize sensor properties and to investigate wafer-to-wafer bonding technologies. This first prototype is made of a matrix of 36 x 16 pixels of size compatible with the FE-I4 readout chip (i.e. 50 μm x 250 μm). Results from lab characterization of this first submission are shown together with TCAD simulations. Work towards a full size FE-I4 sensor for wafer-to-wafer bonding is discussed.

  6. Performance of active edge pixel sensors

    Science.gov (United States)

    Bomben, M.; Ducourthial, A.; Bagolini, A.; Boscardin, M.; Bosisio, L.; Calderini, G.; D'Eramo, L.; Giacomini, G.; Marchiori, G.; Zorzi, N.; Rummler, A.; Weingarten, J.

    2017-05-01

    To cope with the High Luminosity LHC harsh conditions, the ATLAS inner tracker has to be upgraded to meet requirements in terms of radiation hardness, pile up and geometrical acceptance. The active edge technology allows to reduce the insensitive area at the border of the sensor thanks to an ion etched trench which avoids the crystal damage produced by the standard mechanical dicing process. Thin planar n-on-p pixel sensors with active edge have been designed and produced by LPNHE and FBK foundry. Two detector module prototypes, consisting of pixel sensors connected to FE-I4B readout chips, have been tested with beams at CERN and DESY. In this paper the performance of these modules are reported. In particular the lateral extension of the detection volume, beyond the pixel region, is investigated and the results show high hit efficiency also at the detector edge, even in presence of guard rings.

  7. Electrical Characteristics of Silicon Pixel Sensors

    CERN Document Server

    Gorelov, I; Hoeferkamp, M; Mata-Bruni, V; Santistevan, G; Seidel, S C; Ciocio, A; Einsweiler, K F; Emes, J; Gilchriese, M G D; Joshi, A; Kleinfelder, S A; Marchesini, R; McCormack, F; Milgrome, O; Palaio, N; Pengg, F; Richardson, J; Zizka, G; Ackers, M; Comes, G; Fischer, P; Keil, M; Klasen, V; Kühl, T; Meuser, S; Ockenfels, W; Raith, B; Treis, J; Wermes, N; Gössling, C; Hügging, F G; Klaiber Lodewigs, Jonas M; Krasel, O; Wüstenfeld, J; Wunstorf, R; Barberis, D; Beccherle, R; Caso, Carlo; Cervetto, M; Darbo, G; Gagliardi, G; Gemme, C; Morettini, P; Netchaeva, P; Osculati, B; Rossi, L; Charles, E; Fasching, D; Blanquart, L; Breugnon, P; Calvet, D; Clemens, J-C; Delpierre, P A; Hallewell, G D; Laugier, D; Mouthuy, T; Rozanov, A; Valin, I; Andreazza, A; Caccia, M; Citterio, M; Lari, T; Meroni, C; Ragusa, F; Troncon, C; Vegni, G; Lutz, Gerhard; Richter, R H; Rohe, T; Boyd, GR; Skubic, P L; Sícho, P; Tomasek, L; Vrba, V; Holder, M; Ziolkowski, M; Cauz, D; Cobal-Grassmann, M; D'Auria, S; De Lotto, B; del Papa, C; Grassmann, H; Santi, L; Becks, K H; Lenzen, G; Linder, C

    2001-01-01

    Prototype sensors for the ATLAS silicon pixel detector have been electrically characterized. The current and voltage characteristics, charge collection efficiencies, and resolutions have been examined. Devices were fabricated on oxygenated and standard detector-grade silicon wafers. Results from prototypes which examine p-stop and standard and moderated p-spray isolation are presented for a variety of geometrical options. Some of the comparisons relate unirradiated sensors with those that have received fluences relevant to LHC operation.

  8. What's A Pixel Particle Sensor Chip?

    CERN Multimedia

    2008-01-01

    ATLAS particle physics experiment aided with collaboration ON Semiconductor was recently honored by the European Council for Nuclear Research (CERN), with an Industrial Award recognizing the company's contribution in supplying complex "Pixel Particle Sensor" chips for use in CERN's ATLAS particle physics experiment.

  9. Active Pixel Sensors: Are CCD's Dinosaurs?

    Science.gov (United States)

    Fossum, Eric R.

    1993-01-01

    Charge-coupled devices (CCD's) are presently the technology of choice for most imaging applications. In the 23 years since their invention in 1970, they have evolved to a sophisticated level of performance. However, as with all technologies, we can be certain that they will be supplanted someday. In this paper, the Active Pixel Sensor (APS) technology is explored as a possible successor to the CCD. An active pixel is defined as a detector array technology that has at least one active transistor within the pixel unit cell. The APS eliminates the need for nearly perfect charge transfer -- the Achilles' heel of CCDs. This perfect charge transfer makes CCD's radiation 'soft,' difficult to use under low light conditions, difficult to manufacture in large array sizes, difficult to integrate with on-chip electronics, difficult to use at low temperatures, difficult to use at high frame rates, and difficult to manufacture in non-silicon materials that extend wavelength response.

  10. Noise in a CMOS digital pixel sensor

    Institute of Scientific and Technical Information of China (English)

    Zhang Chi; Yao Suying; Xu Jiangtao

    2011-01-01

    Based on the study of noise performance in CMOS digital pixel sensor (DPS),a mathematical model of noise is established with the pulse-width-modulation (PWM) principle.Compared with traditional CMOS image sensors,the integration time is different and A/D conversion is implemented in each PWM DPS pixel.Then,the quantitative calculating formula of system noise is derived.It is found that dark current shot noise is the dominant noise source in low light region while photodiode shot noise becomes significantly important in the bright region.In this model,photodiode shot noise does not vary with luminance,but dark current shot noise does.According to increasing photodiode capacitance and the comparator's reference voltage or optimizing the mismatch in the comparator,the total noise can be reduced.These results serve as a guideline for the design of PWM DPS.

  11. Sensor development for the CMS pixel detector

    CERN Document Server

    Bölla, G; Horisberger, R P; Kaufmann, R; Rohe, T; Roy, A

    2002-01-01

    The CMS experiment which is currently under construction at the Large Hadron Collider (LHC) at CERN (Geneva, Switzerland) will contain a pixel detector which provides in its final configuration three space points per track close to the interaction point of the colliding beams. Because of the harsh radiation environment of the LHC, the technical realization of the pixel detector is extremely challenging. The readout chip as the most damageable part of the system is believed to survive a particle fluence of 6x10 sup 1 sup 4 n sub e sub q /cm sup 2 (All fluences are normalized to 1 MeV neutrons and therefore all components of the hybrid pixel detector have to perform well up to at least this fluence. As this requires a partially depleted operation of the silicon sensors after irradiation-induced type inversion of the substrate, an ''n in n'' concept has been chosen. In order to perform IV-tests on wafer level and to hold accidentally unconnected pixels close to ground potential, a resistive path between the pixe...

  12. ATLAS ITk and new pixel sensors technologies

    CERN Document Server

    Gaudiello, A

    2016-01-01

    During the 2023–2024 shutdown, the Large Hadron Collider (LHC) will be upgraded to reach an instantaneous luminosity up to 7×10$^{34}$ cm$^{−2}$s$^{−1}$. This upgrade of the accelerator is called High-Luminosity LHC (HL-LHC). The ATLAS detector will be changed to meet the challenges of HL-LHC: an average of 200 pile-up events in every bunch crossing, and an integrated luminosity of 3000 fb $^{−1}$ over ten years. The HL-LHC luminosity conditions are too extreme for the current silicon (pixel and strip) detectors and straw tube transition radiation tracker (TRT) of the current ATLAS tracking system. Therefore the ATLAS inner tracker is being completely rebuilt for data-taking and the new system is called Inner Tracker (ITk). During this upgrade the TRT will be removed in favor of an all-new all-silicon tracker composed only by strip and pixel detectors. An overview of new layouts in study will be reported and the new pixel sensor technologies in development will be explained.

  13. Radiation Tolerance of CMOS Monolithic Active Pixel Sensors with Self-Biased Pixels

    CERN Document Server

    Deveaux, M; Besson, A; Claus, G; Colledani, C; Dorokhov, M; Dritsa, C; Dulinski, W; Fröhlich, I; Goffe, M; Grandjean, D; Heini, S; Himmi, A; Hu, C; Jaaskelainen, K; Müntz, C; Shabetai, A; Stroth, J; Szelezniak, M; Valin, I; Winter, M

    2009-01-01

    CMOS Monolithic Active Pixel Sensors (MAPS) are proposed as a technology for various vertex detectors in nuclear and particle physics. We discuss the mechanisms of ionizing radiation damage on MAPS hosting the the dead time free, so-called self bias pixel. Moreover, we discuss radiation hardened sensor designs which allow operating detectors after exposing them to irradiation doses above 1 Mrad

  14. Characterization of active CMOS sensors for capacitively coupled pixel detectors

    Energy Technology Data Exchange (ETDEWEB)

    Hirono, Toko; Gonella, Laura; Janssen, Jens; Hemperek, Tomasz; Huegging, Fabian; Krueger, Hans; Wermes, Norbert [Institute of Physics, University of Bonn (Germany); Peric, Ivan [Institut fuer Prozessdatenverarbeitung und Elektronik, Karlsruher Institut fuer Technologie, Karlsruhe (Germany)

    2015-07-01

    Active CMOS pixel sensor is one of the most attractive candidates for detectors of upcoming particle physics experiments. In contrast to conventional sensors of hybrid detectors, signal processing circuit can be integrated in the active CMOS sensor. The characterization and optimization of the pixel circuit are indispensable to obtain a good performance from the sensors. The prototype chips of the active CMOS sensor were fabricated in the AMS 180nm and L-Foundry 150 nm CMOS processes, respectively a high voltage and high resistivity technology. Both chips have a charge sensitive amplifier and a comparator in each pixel. The chips are designed to be glued to the FEI4 pixel readout chip. The signals from 3 pixels of the prototype chips are capacitively coupled to the FEI4 input pads. We have performed lab tests and test beams to characterize the prototypes. In this presentation, the measurement results of the active CMOS prototype sensors are shown.

  15. CMOS monolithic pixel sensors research and development at LBNL

    Indian Academy of Sciences (India)

    D Contarato; J-M Bussat; P Denes; L Griender; T Kim; T Stezeberger; H Weiman; M Battaglia; B Hooberman; L Tompkins

    2007-12-01

    This paper summarizes the recent progress in the design and characterization of CMOS pixel sensors at LBNL. Results of lab tests, beam tests and radiation hardness tests carried out at LBNL on a test structure with pixels of various sizes are reported. The first results of the characterization of back-thinned CMOS pixel sensors are also reported, and future plans and activities are discussed.

  16. Mapping Electrical Crosstalk in Pixelated Sensor Arrays

    Science.gov (United States)

    Seshadri, Suresh (Inventor); Cole, David (Inventor); Smith, Roger M (Inventor); Hancock, Bruce R. (Inventor)

    2013-01-01

    The effects of inter pixel capacitance in a pixilated array may be measured by first resetting all pixels in the array to a first voltage, where a first image is read out, followed by resetting only a subset of pixels in the array to a second voltage, where a second image is read out, where the difference in the first and second images provide information about the inter pixel capacitance. Other embodiments are described and claimed.

  17. Mapping Electrical Crosstalk in Pixelated Sensor Arrays

    Science.gov (United States)

    Seshadri, Suresh (Inventor); Cole, David (Inventor); Smith, Roger M. (Inventor); Hancock, Bruce R. (Inventor)

    2017-01-01

    The effects of inter pixel capacitance in a pixilated array may be measured by first resetting all pixels in the array to a first voltage, where a first image is read out, followed by resetting only a subset of pixels in the array to a second voltage, where a second image is read out, where the difference in the first and second images provide information about the inter pixel capacitance. Other embodiments are described and claimed.

  18. Development of radiation hardened pixel sensors for charged particle detection

    CERN Document Server

    Koziel, Michal

    2014-01-01

    CMOS Pixel Sensors are being developed since a few years to equip vertex detectors for future high-energy physics experiments with the crucial advantages of a low material budget and low production costs. The features simultaneously required are a short readout time, high granularity and high tolerance to radiation. This thesis mainly focuses on the radiation tolerance studies. To achieve the targeted readout time (tens of microseconds), the sensor pixel readout was organized in parallel columns restricting in addition the readout to pixels that had collected the signal charge. The pixels became then more complex, and consequently more sensitive to radiation. Different in-pixel architectures were studied and it was concluded that the tolerance to ionizing radiation was limited to 300 krad with the 0.35- m fabrication process currently used, while the targeted value was several Mrad. Improving this situation calls for implementation of the sensors in processes with a smaller feature size which naturally imp...

  19. A neighbor pixel communication filtering structure for Dynamic Vision Sensors

    Science.gov (United States)

    Xu, Yuan; Liu, Shiqi; Lu, Hehui; Zhang, Zilong

    2017-02-01

    For Dynamic Vision Sensors (DVS), thermal noise and junction leakage current induced Background Activity (BA) is the major cause of the deterioration of images quality. Inspired by the smoothing filtering principle of horizontal cells in vertebrate retina, A DVS pixel with Neighbor Pixel Communication (NPC) filtering structure is proposed to solve this issue. The NPC structure is designed to judge the validity of pixel's activity through the communication between its 4 adjacent pixels. The pixel's outputs will be suppressed if its activities are determined not real. The proposed pixel's area is 23.76×24.71μm2 and only 3ns output latency is introduced. In order to validate the effectiveness of the structure, a 5×5 pixel array has been implemented in SMIC 0.13μm CIS process. 3 test cases of array's behavioral model show that the NPC-DVS have an ability of filtering the BA.

  20. Edge pixel response studies of edgeless silicon sensor technology for pixellated imaging detectors

    Science.gov (United States)

    Maneuski, D.; Bates, R.; Blue, A.; Buttar, C.; Doonan, K.; Eklund, L.; Gimenez, E. N.; Hynds, D.; Kachkanov, S.; Kalliopuska, J.; McMullen, T.; O'Shea, V.; Tartoni, N.; Plackett, R.; Vahanen, S.; Wraight, K.

    2015-03-01

    Silicon sensor technologies with reduced dead area at the sensor's perimeter are under development at a number of institutes. Several fabrication methods for sensors which are sensitive close to the physical edge of the device are under investigation utilising techniques such as active-edges, passivated edges and current-terminating rings. Such technologies offer the goal of a seamlessly tiled detection surface with minimum dead space between the individual modules. In order to quantify the performance of different geometries and different bulk and implant types, characterisation of several sensors fabricated using active-edge technology were performed at the B16 beam line of the Diamond Light Source. The sensors were fabricated by VTT and bump-bonded to Timepix ROICs. They were 100 and 200 μ m thick sensors, with the last pixel-to-edge distance of either 50 or 100 μ m. The sensors were fabricated as either n-on-n or n-on-p type devices. Using 15 keV monochromatic X-rays with a beam spot of 2.5 μ m, the performance at the outer edge and corners pixels of the sensors was evaluated at three bias voltages. The results indicate a significant change in the charge collection properties between the edge and 5th (up to 275 μ m) from edge pixel for the 200 μ m thick n-on-n sensor. The edge pixel performance of the 100 μ m thick n-on-p sensors is affected only for the last two pixels (up to 110 μ m) subject to biasing conditions. Imaging characteristics of all sensor types investigated are stable over time and the non-uniformities can be minimised by flat-field corrections. The results from the synchrotron tests combined with lab measurements are presented along with an explanation of the observed effects.

  1. Small pitch pixel sensors\\\\ for the CMS Phase II upgrade

    CERN Document Server

    Steinbrueck, Georg

    2015-01-01

    The CMS collaboration has undertaken two sensor R\\&D programs on thin n-in-p planar and 3D silicon sensor technologies. To cope with the increase in instantaneous luminosity, the pixel area has to be reduced to approximately 2500 $\\mu$m$^{2}$ to keep the occupancy at the percent level. Suggested pixel cell geometries to match this requirement are {50$\\times$50 }$\\mu$...

  2. Planar Pixel Sensors for the ATLAS Upgrade: Beam Tests results

    CERN Document Server

    Weingarten, J; Beimforde, M; Benoit, M; Bomben, M; Calderini, G; Gallrapp, C; George, M; Gibson, S; Grinstein, S; Janoska, Z; Jentzsch, J; Jinnouchi, O; Kishida, T; La Rosa, A; Libov, V; Macchiolo, A; Marchiori, G; Münstermann, D; Nagai, R; Piacquadio, G; Ristic, B; Rubinskiy, I; Rummler, A; Takubo, Y; Troska, G; Tsiskaridtze, S; Tsurin, I; Unno, Y; Weigel, P; Wittig, T

    2012-01-01

    Results of beam tests with planar silicon pixel sensors aimed towards the ATLAS Insertable B-Layer and High Luminosity LHC (HL-LHC) upgrades are presented. Measurements include spatial resolution, charge collection performance and charge sharing between neighbouring cells as a function of track incidence angle for different bulk materials. Measurements of n-in-n pixel sensors are presented as a function of fluence for different irradiations. Furthermore p-type silicon sensors from several vendors with slightly differing layouts were tested. All tested sensors were connected by bump-bonding to the ATLAS Pixel read-out chip. We show that both n-type and p-type tested planar sensors are able to collect significant charge even after integrated fluences expected at HL-LHC.

  3. Development of CMOS Pixel Sensors with digital pixel dedicated to future particle physics experiments

    Science.gov (United States)

    Zhao, W.; Wang, T.; Pham, H.; Hu-Guo, C.; Dorokhov, A.; Hu, Y.

    2014-02-01

    Two prototypes of CMOS pixel sensor with in-pixel analog to digital conversion have been developed in a 0.18 μm CIS process. The first design integrates a discriminator into each pixel within an area of 22 × 33 μm2 in order to meet the requirements of the ALICE inner tracking system (ALICE-ITS) upgrade. The second design features 3-bit charge encoding inside a 35 × 35 μm2 pixel which is motivated by the specifications of the outer layers of the ILD vertex detector (ILD-VXD). This work aims to validate the concept of in-pixel digitization which offers higher readout speed, lower power consumption and less dead zone compared with the column-level charge encoding.

  4. Performance of active edge pixel sensors

    CERN Document Server

    Bomben, Marco; Bagolini, Alvise; Boscardin, Maurizio; Bosisio, Luciano; Calderini, Giovanni; D'Eramo, Louis; Giacomini, Gabriele; Marchiori, Giovanni; Zorzi, Nicola; Rummler, Andre; Weingarten, Jens

    2017-01-01

    this paper the performance of these modules are reported. In particular the lateral extension of the detection volume, beyond the pixel region, is investigated and the results show high hit efficiency also at the detector edge, even in presence of guard rings.

  5. Testbeam and Laboratory Characterization of CMS 3D Pixel Sensors

    CERN Document Server

    Bubna, M; Krzywda, A; Koybasi, O; Arndt, K; Bortoletto, D; Shipsey, I; Bolla, G; Kok, A; Hansen, T -E; Hansen, T A; Jensen, G U; Brom, J M; Boscardin, M; Chramowicz, J; Cumalat, J; Betta, G F Dalla; Dinardo, M; Godshalk, A; Jones, M; Krohn, M D; Kumar, A; Lei, C M; Moroni, L; Perera, L; Povoli, M; Prosser, A; Rivera, R; Solano, A; Obertino, M M; Kwan, S; Uplegger, L; Via, C D; Vigani, L; Wagner, S

    2014-01-01

    The pixel detector is the innermost tracking device in CMS, reconstructing interaction vertices and charged particle trajectories. The sensors located in the innermost layers of the pixel detector must be upgraded for the ten-fold increase in luminosity expected with the High- Luminosity LHC (HL-LHC) phase. As a possible replacement for planar sensors, 3D silicon technology is under consideration due to its good performance after high radiation fluence. In this paper, we report on pre- and post- irradiation measurements for CMS 3D pixel sensors with different electrode configurations. The effects of irradiation on electrical properties, charge collection efficiency, and position resolution of 3D sensors are discussed. Measurements of various test structures for monitoring the fabrication process and studying the bulk and surface properties, such as MOS capacitors, planar and gate-controlled diodes are also presented.

  6. Design and test of pixel sensors for the CMS experiment

    CERN Document Server

    Bölla, G; Rott, C; Roy, A; Kwan, S; Chien, C Y; Cho, H; Gobbi, B; Horisberger, R P; Kaufmann, R

    2001-01-01

    The Compact Muon Solenoid (CMS) experiment at the Large Hadron Collider (LHC) will have a silicon pixel detector as its innermost tracking device. The pixel system will be exposed to the harsh radiation environment of the LHC. Prototype sensors have been designed to meet the specifications of the CMS experiment. The sensors are n/sup +/-n devices to allow partial depletion operation after bulk type inversion. The isolation of the n/sup +/ pixels is provided through a novel double open p-ring design that allows sensor testing before bump bonding and flip chipping. The prototype wafers contain a variety of p-stop designs and are fabricated by two vendors on different bulk substrates including oxygenated silicon. A study of the static measurement of the prototype sensors before irradiation is presented. (2 refs).

  7. Two-dimensional pixel array image sensor for protein crystallography

    Energy Technology Data Exchange (ETDEWEB)

    Beuville, E.; Beche, J.-F.; Cork, C. [and others

    1996-07-01

    A 2D pixel array image sensor module has been designed for time resolved Protein Crystallography. This smart pixels detector significantly enhances time resolved Laue Protein crystallography by two to three orders of magnitude compared to existing sensors like films or phosphor screens coupled to CCDs. The resolution in time and dynamic range of this type of detector will allow one to study the evolution of structural changes that occur within the protein as a function of time. This detector will also considerably accelerate data collection in static Laue or monochromatic crystallography and make better use of the intense beam delivered by synchrotron light sources. The event driven pixel array detectors, based on the column Architecture, can provide multiparameter information (energy discrimination, time), with sparse and frameless readout without significant dead time. The prototype module consists of a 16x16 pixel diode array bump-bonded to the integrated circuit. The detection area is 150x150 square microns.

  8. Image Restoration After Pixel Binning in Image Sensors

    Institute of Scientific and Technical Information of China (English)

    LI Hao; ZHANG Hui; GUO Xiaolian; HU Guangshu

    2009-01-01

    A method was developed to restore degraded images to some extent after the pixel binning pro-cess in image sensors to improve the resolution. A pixel binning model was used to approximate the original un-binned image. Then, the least squares error criterion was used as a constraint to reconstruct the re-stored pixel values from the binning model. The technique achieves about a one-decibel increase in the peak signal-to-noise ratio compared with the odginal estimated image. The technique has good detail pre-servation performance as well as low computation load. Thus, this restoration technique provides valuable improvements in practical, real time image processing.

  9. Scaling and Pixel Crosstalk Considerations for CMOS Image Sensor

    Institute of Scientific and Technical Information of China (English)

    JIN Xiang-liang; CHEN Jie(member,IEEE); QIU Yu-lin

    2003-01-01

    With the scaling development of the minimum lithographic size,the scaling trend of CMOS imager pixel size and fill factor has been computed according to the Moore rule.When the CMOS minimum lithographic feature scales down to 0.35 μm,the CCD image pixel size is not so easy to be reduced and but the CMOS image pixel size benefits from the scaling minimum lithographic feature. However, when the CMOS technology is downscaled to or under 0.35 μm,the fabrication of CMOS image sensors will be limited by the standard CMOS process in both ways of shallow trench isolation and source/drain junction,which results in pixel crosstalk.The impact of the crosstalk on the active pixel CMOS image sensor is analyzed based on the technology scaling.Some suppressed crosstalk methods have been reviewed.The best way is that combining the advantages of CMOS and SOI technology to fabricate the image sensors will reduce the pixel crosstalk.

  10. Fully depleted CMOS pixel sensor development and potential applications

    Energy Technology Data Exchange (ETDEWEB)

    Baudot, J.; Kachel, M. [Universite de Strasbourg, IPHC, 23 rue du Loess 67037 Strasbourg (France); CNRS, UMR7178, 67037 Strasbourg (France)

    2015-07-01

    CMOS pixel sensors are often opposed to hybrid pixel sensors due to their very different sensitive layer. In standard CMOS imaging processes, a thin (about 20 μm) low resistivity epitaxial layer acts as the sensitive volume and charge collection is mostly driven by thermal agitation. In contrast, the so-called hybrid pixel technology exploits a thick (typically 300 μm) silicon sensor with high resistivity allowing for the depletion of this volume, hence charges drift toward collecting electrodes. But this difference is fading away with the recent availability of some CMOS imaging processes based on a relatively thick (about 50 μm) high resistivity epitaxial layer which allows for full depletion. This evolution extents the range of applications for CMOS pixel sensors where their known assets, high sensitivity and granularity combined with embedded signal treatment, could potentially foster breakthrough in detection performances for specific scientific instruments. One such domain is the Xray detection for soft energies, typically below 10 keV, where the thin sensitive layer was previously severely impeding CMOS sensor usage. Another application becoming realistic for CMOS sensors, is the detection in environment with a high fluence of non-ionizing radiation, such as hadron colliders. However, when considering highly demanding applications, it is still to be proven that micro-circuits required to uniformly deplete the sensor at the pixel level, do not mitigate the sensitivity and efficiency required. Prototype sensors in two different technologies with resistivity higher than 1 kΩ, sensitive layer between 40 and 50 μm and featuring pixel pitch in the range 25 to 50 μm, have been designed and fabricated. Various biasing architectures were adopted to reach full depletion with only a few volts. Laboratory investigations with three types of sources (X-rays, β-rays and infrared light) demonstrated the validity of the approach with respect to depletion, keeping a

  11. Intrinsic Pixel Size Variation in an LSST Prototype Sensor

    CERN Document Server

    Baumer, Michael

    2015-01-01

    The ambitious science goals of the Large Synoptic Survey Telescope (LSST) have motivated a search for new and unexpected sources of systematic error in the LSST camera. Flat-field images are a rich source of data on sensor anomalies, although such effects are typically dwarfed by shot noise in a single flat field. After combining many ($\\sim 500$) such images into `ultraflats' to reduce the impact of shot noise, we perform photon transfer analysis on a pixel-by-pixel basis and observe no spatial structure in pixel linearity or gain at light levels of 100 ke$^-$ and below. At 125 ke$^-$, a columnar structure is observed in the gain map--we attribute this to a flux-dependent charge transfer inefficiency. We also probe small-scale variations in effective pixel size by analyzing pixel-neighbor correlations in ultraflat images, where we observe clear evidence of intrinsic variation in effective pixel size in an LSST prototype sensor near the $\\sim .3\\%$ level.

  12. Digital Pixel Sensor Array with Logarithmic Delta-Sigma Architecture

    Science.gov (United States)

    Mahmoodi, Alireza; Li, Jing; Joseph, Dileepan

    2013-01-01

    Like the human eye, logarithmic image sensors achieve wide dynamic range easily at video rates, but, unlike the human eye, they suffer from low peak signal-to-noise-and-distortion ratios (PSNDRs). To improve the PSNDR, we propose integrating a delta-sigma analog-to-digital converter (ADC) in each pixel. An image sensor employing this architecture is designed, built and tested in 0.18 micron complementary metal-oxide-semiconductor (CMOS) technology. It achieves a PSNDR better than state-of-the-art logarithmic sensors and comparable to the human eye. As the approach concerns an array of many ADCs, we use a small-area low-power delta-sigma design. For scalability, each pixel has its own decimator. The prototype is compared to a variety of other image sensors, linear and nonlinear, from industry and academia. PMID:23959239

  13. Digital Pixel Sensor Array with Logarithmic Delta-Sigma Architecture

    Directory of Open Access Journals (Sweden)

    Jing Li

    2013-08-01

    Full Text Available Like the human eye, logarithmic image sensors achieve wide dynamic range easily at video rates, but, unlike the human eye, they suffer from low peak signal-to-noise-and-distortion ratios (PSNDRs. To improve the PSNDR, we propose integrating a delta-sigma analog-to-digital converter (ADC in each pixel. An image sensor employing this architecture is designed, built and tested in 0.18 micron complementary metal-oxide-semiconductor (CMOS technology. It achieves a PSNDR better than state-of-the-art logarithmic sensors and comparable to the human eye. As the approach concerns an array of many ADCs, we use a small-area low-power delta-sigma design. For scalability, each pixel has its own decimator. The prototype is compared to a variety of other image sensors, linear and nonlinear, from industry and academia.

  14. Digital pixel sensor array with logarithmic delta-sigma architecture.

    Science.gov (United States)

    Mahmoodi, Alireza; Li, Jing; Joseph, Dileepan

    2013-08-16

    Like the human eye, logarithmic image sensors achieve wide dynamic range easily at video rates, but, unlike the human eye, they suffer from low peak signal-to-noise-and-distortion ratios (PSNDRs). To improve the PSNDR, we propose integrating a delta-sigma analog-to-digital converter (ADC) in each pixel. An image sensor employing this architecture is designed, built and tested in 0.18 micron complementary metal-oxide-semiconductor (CMOS) technology. It achieves a PSNDR better than state-of-the-art logarithmic sensors and comparable to the human eye. As the approach concerns an array of many ADCs, we use a small-area low-power delta-sigma design. For scalability, each pixel has its own decimator. The prototype is compared to a variety of other image sensors, linear and nonlinear, from industry and academia.

  15. A low light level sensor with dark current compensating pixels

    Science.gov (United States)

    Perley, Mitchell; Baxter, Patrick; Raynor, Jeffrey M.; Renshaw, David

    2008-09-01

    In ultra-low light conditions the presence of dark current becomes a major source of noise for a CMOS sensor. Standard dark current compensation techniques, such as using a dark reference frame, bring significant improvements to dark noise in typical applications. However, applications requiring long integration times mean that such techniques cannot always be used. This paper presents a differential dark current compensating pixel. The pixel is made up of a differential amplifier and two photodiodes: one light shielded photodiode connected to the non-inverting input of the opamp and a light detecting photodiode connected to the inverting input of the opamp. An integrating capacitor is used in the feedback loop to convert photocurrent to voltage, and a switched capacitor network is present in parallel with the light shielded pixel, which is used to satisfy the output equation to compensate the dark current. The pixel uses 150 μm x 150 μm photodiodes and is fabricated in a standard 0.18 μm, 6M1P, CMOS process. The results show that the pixel is light sensitive and has a linear output as expected. However, the dark current is not predictably controlled. Further work will be carried out on the pixel design, and particularly the switched capacitor circuit, to determine the cause of the non-predictability of the pixel output.

  16. Silicon Avalanche Pixel Sensor for High Precision Tracking

    CERN Document Server

    D'Ascenzo, N; Moon, C S; Morsani, F; Ratti, L; Saveliev, V; Navarro, A Savoy; Xie, Q

    2013-01-01

    The development of an innovative position sensitive pixelated sensor to detect and measure with high precision the coordinates of the ionizing particles is proposed. The silicon avalanche pixel sensors (APiX) is based on the vertical integration of avalanche pixels connected in pairs and operated in coincidence in fully digital mode and with the processing electronics embedded on the chip. The APiX sensor addresses the need to minimize the material budget and related multiple scattering effects in tracking systems requiring a high spatial resolution in the presence of a large occupancy. The expected operation of the new sensor features: low noise, low power consumption and suitable radiation tolerance. The APiX device provides on-chip digital information on the position of the coordinate of the impinging charged particle and can be seen as the building block of a modular system of pixelated arrays, implementing a sparsified readout. The technological challenges are the 3D integration of the device under CMOS ...

  17. A CMOS active pixel sensor for retinal stimulation

    Science.gov (United States)

    Prydderch, Mark L.; French, Marcus J.; Mathieson, Keith; Adams, Christopher; Gunning, Deborah; Laudanski, Jonathan; Morrison, James D.; Moodie, Alan R.; Sinclair, James

    2006-02-01

    Degenerative photoreceptor diseases, such as age-related macular degeneration and retinitis pigmentosa, are the most common causes of blindness in the western world. A potential cure is to use a microelectronic retinal prosthesis to provide electrical stimulation to the remaining healthy retinal cells. We describe a prototype CMOS Active Pixel Sensor capable of detecting a visual scene and translating it into a train of electrical pulses for stimulation of the retina. The sensor consists of a 10 x 10 array of 100 micron square pixels fabricated on a 0.35 micron CMOS process. Light incident upon each pixel is converted into output current pulse trains with a frequency related to the light intensity. These outputs are connected to a biocompatible microelectrode array for contact to the retinal cells. The flexible design allows experimentation with signal amplitudes and frequencies in order to determine the most appropriate stimulus for the retina. Neural processing in the retina can be studied by using the sensor in conjunction with a Field Programmable Gate Array (FPGA) programmed to behave as a neural network. The sensor has been integrated into a test system designed for studying retinal response. We present the most recent results obtained from this sensor.

  18. Improving Charge-Collection Efficiency of Kyoto's SOI Pixel Sensors

    CERN Document Server

    Matsumura, Hideaki; Tanaka, Takaaki; Takeda, Ayaki; Ito, Makoto; Ohmura, Syunichi; Arai, Yasuo; Mori, Koji; Nishioka, Yusuke; Takenaka, Ryota; Kohmura, Takayoshi

    2015-01-01

    We have been developing X-ray SOIPIXs for next-generation satellites for X-ray astronomy. Their high time resolution ($\\sim10~\\mu$s) and event-trigger-output function enable us to read out without pile-ups and to use anti-coincidence systems. Their performance in imaging spectroscopy is comparable to that in the CCDs. A problem in our previous model was degradation of charge-collection efficiency (CCE) at pixel borders. We measured the response in the sub-pixel scale, using finely collimated X-ray beams at $10~\\mu$m\\Phi$ at SPring-8, and investigated the non-uniformity of the CCE within a pixel. We found that the X-ray detection efficiency and CCE degrade in the sensor region under the pixel circuitry placed outside the buried p-wells (BPW). A 2D simulation of the electric fields shows that the isolated pixel-circuitry outside the BPW creates local minimums in the electric potentials at the interface between the sensor and buried oxide layers. Thus, a part of signal charge is trapped there and is not collecte...

  19. Development of Active Pixel Photodiode Sensors for Gamma Camera Application

    CERN Document Server

    Salahuddin, Nur Sultan; Heruseto, Brahmantyo; Parmentier, Michel

    2011-01-01

    We designed new photodiodes sensors including current mirror amplifiers. These photodiodes have been fabricated using a CMOS 0.6 micrometers process from Austria Micro System (AMS). The Photodiode areas are respectiveley 1mm x 1mm and 0.4mm x 0.4mm with fill factor 98 % and total chip area is 2 square millimetres. The sensor pixels show a logarithmic response in illumination and are capable of detecting very low blue light (less than 0.5 lux) . These results allow to use our sensor in new Gamma Camera solid-state concept.

  20. 3D silicon pixel sensors: Recent test beam results

    CERN Document Server

    Hansson, P; Sandaker, H; Korolkov, I; Barrera, C; Wermes, N; Borri, M; Grinstein, S; Troyano, I; Grenier, P; Devetak, E; Fleta, C; Kenney, C; Tsybychev, D; Nellist, C; Chmeissan, M; Su, D; DeWilde, B; Silverstein, D; Dorholt, O; Tsung, J; Sjoebaek, K; Stupak, J; Slaviec, T; Micelli, A; Helle, K; Bolle, E; Huegging, F; Kocian, M; Fazio, S; Balbuena, J; Dalla Betta, G F; La Rosa, A; Rivero, F; Mastroberardino, A; Hasi, J; Darbo, G; Boscardin, M; Da Via, C; Nordahl, P; Giordani, M; Jackson, P; Rohne, O; Gemme, C; Young, C

    2011-01-01

    The 3D silicon sensors aimed for the ATLAS pixel detector upgrade have been tested with a high energy pion beam at the CERN SPS in 2009. Two types of sensor layouts were tested: full-3D assemblies fabricated in Stanford, where the electrodes penetrate the entire silicon wafer thickness, and modified-3D assemblies fabricated at FBK-irst with partially overlapping electrodes. In both cases three read-out electrodes are ganged together to form pixels of dimension 50 x 400 mu m(2). Data on the pulse height distribution, tracking efficiency and resolution were collected for various particle incident angles, with and without a 1.6 T magnetic field. Data from a planar sensor of the type presently used in the ATLAS detector were used at the same time to give comparison. Published by Elsevier B.V.

  1. 3D silicon pixel sensors: Recent test beam results

    Energy Technology Data Exchange (ETDEWEB)

    Hansson, P., E-mail: phansson@cern.c [University of Oslo (Norway); Balbuena, J.; Barrera, C. [CNM Barcelona (Spain); Bolle, E. [University of Oslo (Norway); Borri, M. [Torino University (Italy); Boscardin, M. [FBK Trento (Italy); Chmeissan, M. [IFAE Barcelona (Spain); Dalla Betta, G.-F. [Universita di Trento and INFN Trento (Italy); Darbo, G. [INFN Genova (Italy); Da Via, C. [University of Manchester (United Kingdom); Devetak, E.; DeWilde, B. [Stony Brook University (United States); Su, D. [SLAC (United States); Dorholt, O. [University of Oslo (Norway); Fazio, S. [Calabria University (Italy); Fleta, C. [CNM Barcelona (Spain); Gemme, C. [INFN Genova (Italy); Giordani, M. [University of Udine and INFN Udine (Italy); Gjersdal, H. [University of Oslo (Norway); Grenier, P. [SLAC (United States)

    2011-02-01

    The 3D silicon sensors aimed for the ATLAS pixel detector upgrade have been tested with a high energy pion beam at the CERN SPS in 2009. Two types of sensor layouts were tested: full-3D assemblies fabricated in Stanford, where the electrodes penetrate the entire silicon wafer thickness, and modified-3D assemblies fabricated at FBK-irst with partially overlapping electrodes. In both cases three read-out electrodes are ganged together to form pixels of dimension 50x400{mu}m{sup 2}. Data on the pulse height distribution, tracking efficiency and resolution were collected for various particle incident angles, with and without a 1.6 T magnetic field. Data from a planar sensor of the type presently used in the ATLAS detector were used at the same time to give comparison.

  2. New Active Digital Pixel Circuit for CMOS Image Sensor

    Institute of Scientific and Technical Information of China (English)

    2001-01-01

    A new active digital pixel circuit for CMOS image sensor is designed consisting of four components: a photo-transducer, a preamplifier, a sample & hold (S & H) circuit and an A/D converter with an inverter. It is optimized by simulation and adjustment based on 2μm standard CMOS process. Each circuit of the components is designed with specific parameters. The simulation results of the whole pixel circuits show that the circuit has such advantages as low distortion, low power consumption, and improvement of the output performances by using an inverter.

  3. Testbeam and laboratory characterization of 3D CMS pixel sensors

    Science.gov (United States)

    Bubna, Mayur; Krzwyda, Alex; Alagoz, Enver; Bortoletto, Daniela

    2013-04-01

    Future generations of colliders, like High Luminosity Large Hadron Collider (HL-LHC) at CERN will deliver much higher radiation doses to the particle detectors, specifically those closer to the beam line. Inner tracker detectors will be the most affected part, causing increased occupancy and radiation damage to Silicon detectors. Planar Silicon sensors have not shown enough radiation hardness for the innermost layers where the radiation doses can reach values around 10^16 neq/cm^2. As a possible replacement of planar pixel sensors, 3D Silicon technology is under consideration as they show higher radiation hardness, and efficiencies comparable to planar sensors. Several 3D CMS pixel designs were fabricated at FBK, CNM, and SINTEF. They were bump bonded to the CMS pixel readout chip and characterized in the laboratory using radioactive source (Sr90), and at Fermilab MTEST beam test facility. Sensors were also irradiated with 800 MeV protons at Los Alamos National Lab to study post-irradiation behavior. In addition, several diodes and test structures from FBK were studied before and after irradiation. We report the laboratory and testbeam measurement results for the irradiated 3D devices.

  4. Modeling Radiation Damage to Pixel Sensors in the ATLAS Detector

    CERN Document Server

    Nachman, Benjamin Philip; The ATLAS collaboration

    2017-01-01

    Silicon Pixel detectors are at the core of the current and planned upgrade of the ATLAS detector. As the detector in closest proximity to the interaction point, these detectors will be subjected to a significant amount of radiation over their lifetime: prior to the HL-LHC, the innermost layers will receive a fluence in excess of $10^{15}$ 1 MeV $n_\\mathrm{eq}/\\mathrm{cm}^2$ and the HL-LHC detector upgrades must cope with an order of magnitude higher fluence integrated over their lifetimes. This talk presents a digitization model that includes radiation damage effects to the ATLAS Pixel sensors for the first time. After a thorough description of the setup, predictions for basic Pixel cluster properties are presented alongside first validation studies with Run 2 collision data.

  5. Radiation hardness studies on CMOS monolithic pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Battaglia, Marco [Department of Physics, University of California at Berkeley, CA 94720 (United States); Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Bisello, Dario [Dipartimento di Fisica, Universita di Padova and INFN, Sezione di Padova, I-35131 Padova (Italy); Contarato, Devis, E-mail: DContarato@lbl.go [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Denes, Peter; Doering, Dionisio [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Giubilato, Piero [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Dipartimento di Fisica, Universita di Padova and INFN, Sezione di Padova, I-35131 Padova (Italy); Sung Kim, Tae [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Mattiazzo, Serena [Dipartimento di Fisica, Universita di Padova and INFN, Sezione di Padova, I-35131 Padova (Italy); Radmilovic, Velimir [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Zalusky, Sarah [Department of Physics, University of California at Berkeley, CA 94720 (United States); Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)

    2010-12-11

    This paper presents irradiation studies performed on a CMOS monolithic pixel sensor prototype implementing different optimizations of the pixel cell aimed at a superior radiation tolerance. Irradiations with 200 keV electrons up to a total dose of 1.1 Mrad have been performed in view of the utilization of such a design in Transmission Electron Microscopy (TEM) applications. Comparative irradiations were performed with 29 MeV protons up to a 2 Mrad total dose and with 1-14 MeV neutrons up to fluences in excess of 10{sup 13} n{sub eq} cm{sup -2}. Experimental results show an improved performance of pixels designed with Enclosed Layout Transistor (ELT) rules and an optimized layout of the charge collecting diodes.

  6. Characterisation of pixel sensor prototypes for the ALICE ITS upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Reidt, Felix [CERN (Switzerland); Physikalisches Institut, Universitaet Heidelberg (Germany); Collaboration: ALICE-Collaboration

    2014-07-01

    ALICE is preparing a major upgrade of its experimental apparatus to be installed in the second long LHC shutdown (LS2) in the years 2018-2019. A key element of the upgrade is the replacement of the Inner Tracking System (ITS) deploying Monolithic Active Pixel Sensors (MAPS). The upgraded ITS will have a reduced material budget while increasing the pixel density and readout rate capabilities. The novel design leads to higher pointing and momentum resolution as well as a p{sub T} acceptance extended to lower values. The corresponding sensor prototypes were qualified in laboratory measurements and beam tests with respect to their radiation tolerance and detection efficiency. This talk summarises recent results on the characterisation of prototypes belonging to the ALPIDE family.

  7. A Beam Monitor Using Silicon Pixel Sensors for Hadron Therapy

    CERN Document Server

    Wang, Zhen; Fan, Yan; Liu, Jun; Sun, Xiangming; Wang, Dong; Kang, Huili; Sun, Daming; Yang, Ping; Pei, Hua; Huang, Guangming; Xu, Nu; Gao, Chaosong; Xiao, Le

    2016-01-01

    We report the design and test results of a beam monitor developed for online monitoring in hadron therapy. The beam monitor uses eight silicon pixel sensors, \\textit{Topmetal-${II}^-$}, as the anode array. \\textit{Topmetal-${II}^-$} is a charge sensor designed in a CMOS 0.35 $\\mu$m technology. Each \\textit{Topmetal-${II}^-$} sensor has $72\\times72$ pixels. Each pixel size is about $83\\times83$ $\\mu$m$^2$. In our design the beam passes through the beam monitor without hitting the electrodes, making the beam monitor especially suitable for monitoring heavy ion beams. This design also reduces radiation damage to the beam monitor itself. The beam monitor is tested at the Heavy Ion Research Facility in Lanzhou (HIRFL) which provides a carbon ion beam. Results indicate that the beam monitor can measure position, incident angle and intensity of the beam with a position resolution better than 20 $\\mu$m, angular resolution about 0.5$^\\circ$ and intensity statistical accuracy better than 2$\\%$.

  8. A beam monitor using silicon pixel sensors for hadron therapy

    Science.gov (United States)

    Wang, Zhen; Zou, Shuguang; Fan, Yan; Liu, Jun; Sun, Xiangming; Wang, Dong; Kang, Huili; Sun, Daming; Yang, Ping; Pei, Hua; Huang, Guangming; Xu, Nu; Gao, Chaosong; Xiao, Le

    2017-03-01

    We report the design and test results of a beam monitor developed for online monitoring in hadron therapy. The beam monitor uses eight silicon pixel sensors, Topmetal-II-, as the anode array. Topmetal-II- is a charge sensor designed in a CMOS 0.35 μm technology. Each Topmetal-II- sensor has 72×72 pixels and the pixel size is 83×83 μm2. In our design, the beam passes through the beam monitor without hitting the electrodes, making the beam monitor especially suitable for monitoring heavy ion beams. This design also reduces radiation damage to the beam monitor itself. The beam monitor is tested with a carbon ion beam at the Heavy Ion Research Facility in Lanzhou (HIRFL). Results indicate that the beam monitor can measure position, incidence angle and intensity of the beam with a position resolution better than 20 μm, angular resolution about 0.5° and intensity statistical accuracy better than 2%.

  9. Silicon sensors development for the CMS pixel system

    CERN Document Server

    Arndt, Kirk; Bortoletto, Daniela; Giolo, Kim; Horisberger, R P; Rohe, T; Roy, Amitava; Son Seung Hee

    2003-01-01

    The CMS experiment will operate at the Large Hadron Collider (LHC). A hybrid pixel detector located close to the interaction region of the colliding beams will provide high resolution tracking and vertex identification which will be crucial for b quark identification. Because of the radiation environment of the LHC, the performance of the sensors must be carefully evaluated up to a fluence of 6 multiplied by 10**1**4n//e//qcm **-**2. We expect that the sensors will be operated partially depleted during their operation at the LHC and we have implemented an n**+ on n sensor design. We have irradiated prototype sensors to a dose of 1 multiplied by 10 **1**5n //e//qcm**-**2. We present the results of our testing before and after irradiation.

  10. CMOS VLSI Active-Pixel Sensor for Tracking

    Science.gov (United States)

    Pain, Bedabrata; Sun, Chao; Yang, Guang; Heynssens, Julie

    2004-01-01

    An architecture for a proposed active-pixel sensor (APS) and a design to implement the architecture in a complementary metal oxide semiconductor (CMOS) very-large-scale integrated (VLSI) circuit provide for some advanced features that are expected to be especially desirable for tracking pointlike features of stars. The architecture would also make this APS suitable for robotic- vision and general pointing and tracking applications. CMOS imagers in general are well suited for pointing and tracking because they can be configured for random access to selected pixels and to provide readout from windows of interest within their fields of view. However, until now, the architectures of CMOS imagers have not supported multiwindow operation or low-noise data collection. Moreover, smearing and motion artifacts in collected images have made prior CMOS imagers unsuitable for tracking applications. The proposed CMOS imager (see figure) would include an array of 1,024 by 1,024 pixels containing high-performance photodiode-based APS circuitry. The pixel pitch would be 9 m. The operations of the pixel circuits would be sequenced and otherwise controlled by an on-chip timing and control block, which would enable the collection of image data, during a single frame period, from either the full frame (that is, all 1,024 1,024 pixels) or from within as many as 8 different arbitrarily placed windows as large as 8 by 8 pixels each. A typical prior CMOS APS operates in a row-at-a-time ( grolling-shutter h) readout mode, which gives rise to exposure skew. In contrast, the proposed APS would operate in a sample-first/readlater mode, suppressing rolling-shutter effects. In this mode, the analog readout signals from the pixels corresponding to the windows of the interest (which windows, in the star-tracking application, would presumably contain guide stars) would be sampled rapidly by routing them through a programmable diagonal switch array to an on-chip parallel analog memory array. The

  11. A Single-Transistor Active Pixel CMOS Image Sensor Architecture

    Institute of Scientific and Technical Information of China (English)

    ZHANG Guo-An; ZHANG Dong-Wei; HE Jin; SU Yan-Mei; WANG Cheng; CHEN Qin; LIANG Hai-Lang; YE Yun

    2012-01-01

    A single-transistor CMOS active pixel image sensor (1T CMOS APS) architecture is proposed,By switching the photosensing pinned diode,resetting and selecting can be achieved by diode pull-up and capacitive coupling pull-down of the source follower. Thus,the reset and selected transistors can be removed. In addition,the reset and selected signal lines can be shared to reduce the metal signal line,leading to a very high fill factor.The pixel design and operation principles are discussed in detail.The functionality of the proposed 1 T CMOS APS architecture has been experimentally verified using a fabricated chip in a standard 0.35 μm CMOS AMIS technology.

  12. Bonding techniques for hybrid active pixel sensors (HAPS)

    Science.gov (United States)

    Bigas, M.; Cabruja, E.; Lozano, M.

    2007-05-01

    A hybrid active pixel sensor (HAPS) consists of an array of sensing elements which is connected to an electronic read-out unit. The most used way to connect these two different devices is bump bonding. This interconnection technique is very suitable for these systems because it allows a very fine pitch and a high number of I/Os. However, there are other interconnection techniques available such as direct bonding. This paper, as a continuation of a review [M. Lozano, E. Cabruja, A. Collado, J. Santander, M. Ullan, Nucl. Instr. and Meth. A 473 (1-2) (2001) 95-101] published in 2001, presents an update of the different advanced bonding techniques available for manufacturing a hybrid active pixel detector.

  13. Developing a beta source based setup for pixel sensor characterization

    CERN Document Server

    Schouwenberg, Jeroen

    2014-01-01

    The main goal of this project is to provide mono-energetic minimum ionizing electrons from a $^{90}$Sr source using a magnetic monochromator, and thus provide a useful tool for in-lab sensor characterization. The monochromator is calibrated using a setup, with a heavy inorganic scintillator and a PMT, which has been calibrated with a $^{22}$Na gamma source. The average energy of the electrons as a function of the current in the monochromator coil is found to be $1.38\\pm0.01$ keV/mA, taking into consideration the effect of the magnetic field on the signal of the PMT. For integration into the pixel sensor test bench, scintillator-counters (a plastic scintillator connected to a PMT) are used. Their response to the electron energies is observed to follow a saturation curve, which leads to a more identical response for high energetic electrons. A preliminary pixel sensor test bench has been set up and properties such as voltage and discriminator settings have been studied as well as count rates for coincidence cou...

  14. A CMOS Active Pixel Sensor for Charged Particle Detection

    Energy Technology Data Exchange (ETDEWEB)

    Matis, Howard S.; Bieser, Fred; Kleinfelder, Stuart; Rai, Gulshan; Retiere, Fabrice; Ritter, Hans George; Singh, Kunal; Wurzel, Samuel E.; Wieman, Howard; Yamamoto, Eugene

    2002-12-02

    Active Pixel Sensor (APS) technology has shown promise for next-generation vertex detectors. This paper discusses the design and testing of two generations of APS chips. Both are arrays of 128 by 128 pixels, each 20 by 20 {micro}m. Each array is divided into sub-arrays in which different sensor structures (4 in the first version and 16 in the second) and/or readout circuits are employed. Measurements of several of these structures under Fe{sup 55} exposure are reported. The sensors have also been irradiated by 55 MeV protons to test for radiation damage. The radiation increased the noise and reduced the signal. The noise can be explained by shot noise from the increased leakage current and the reduction in signal is due to charge being trapped in the epi layer. Nevertheless, the radiation effect is small for the expected exposures at RHIC and RHIC II. Finally, we describe our concept for mechanically supporting a thin silicon wafer in an actual detector.

  15. Development of a novel pixel-level signal processing chain for fast readout 3D integrated CMOS pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Fu, Y.; Torheim, O.; Hu-Guo, C. [Institut Pluridisciplinaire Hubert Curien (IPHC), 23 rue du loess, BP 28, 67037 Strasbourg (France); Degerli, Y. [CEA Saclay, IRFU/SEDI, 91191 Gif-sur-Yvette Cedex (France); Hu, Y., E-mail: yann.hu@iphc.cnrs.fr [Institut Pluridisciplinaire Hubert Curien (IPHC), 23 rue du loess, BP 28, 67037 Strasbourg (France)

    2013-03-11

    In order to resolve the inherent readout speed limitation of traditional 2D CMOS pixel sensors, operated in rolling shutter readout, a parallel readout architecture has been developed by taking advantage of 3D integration technologies. Since the rows of the pixel array are zero-suppressed simultaneously instead of sequentially, a frame readout time of a few microseconds is expected for coping with high hit rates foreseen in future collider experiments. In order to demonstrate the pixel readout functionality of such a pixel sensor, a 2D proof-of-concept chip including a novel pixel-level signal processing chain was designed and fabricated in a 0.13μm CMOS technology. The functionalities of this chip have been verified through experimental characterization.

  16. Pixel-by-pixel VIS/NIR and LIR sensor fusion system

    Science.gov (United States)

    Zhang, Evan; Zhang, James S.; Song, Vivian W.; Chin, Ken P.; Hu, Gelbert

    2003-01-01

    Visible (VIS) camera (such as CCD) or Near Infrared (NIR) camera (such as low light level CCD or image intensifier) has high resolution and is easy to distinguish enemy and foe, but it cannot see through thin fog/cloud, heavy smoke/dust, foliage, camouflage, and darkness. The Long Infrared (LIR) imager can overcome above problems, but the resolution is too low and it cannot see the NIR aiming light from enemy. The best solution is to fuse the VIS/NIR and LIR sensors to overcome their shortcomings and take advantages of both sensors. In order to see the same target without parallax, the fusio system must have a common optical aperature. In this paper, three common optical apertures are designed: common reflective objective lens, common beam splitter, and common transmissive objective lens. The first one has very small field of view and the second one needs two heads, so the best choice is the third one, but we must find suitable optical materials and correct the color aberrations from 0.6 to 12 μ. It is a tough job. By choosing ZnSe as the first common piece of the objective lens and using glass for NIR and Ge (or IR glass) for LIR as rest pieces, we only need to and are able to correct the aberrations from 0.6 to 1.0 μ for NIR and from 8 to 12 μ for LIR. Finally, a common reflective objective lens and the common beam splitter are also successfully designed. Five application examples are given. In the digital signal processing, we use only one Altera chip. After inserting data, scaling the image size, and adjusting the signal level, the LIR will have the same format and same pixel number of the VIS/NIR, so real-time pixel-by-pixel sensor fusion is realized. The digital output can be used for further image processing and automatic target recognition, such as if we overlap the LIR image on the VIS/NIR image for missile guidance or rifle sight we don't need to worry about the time and the environment again. A gum-size wireless transmitter is also designed that is

  17. Modeling radiation damage to pixel sensors in the ATLAS detector

    CERN Document Server

    Ducourthial, Audrey; The ATLAS collaboration

    2017-01-01

    Silicon pixel detectors are at the core of the current and planned upgrade of the ATLAS detector at the Large Hadron Collider (LHC). As the closest detector component to the interaction point, these detectors will be subjected to a significant amount of radiation over their lifetime: prior to the High-Luminosity LHC (HL-LHC), the innermost layers will receive a fluence in excess of $10^{15}n_{eq}/cm^2$ and the HL-HLC detector upgrades must cope with an order of magnitude higher fluence integrated over their lifetimes. Simulating radiation damage is critical in order to make accurate predictions for current future detector performance that will enable searches for new particles and forces as well as precision measurements of Standard Model particles such as the Higgs boson. We present a digitization model that includes radiation damage effects to the ATLAS pixel sensors for the first time. In addition to thoroughly describing the setup, we present first predictions for basic pixel cluster properties alongside ...

  18. Modeling Radiation Damage to Pixel Sensors in the ATLAS Detector

    CERN Document Server

    Ducourthial, Audrey; The ATLAS collaboration

    2017-01-01

    Silicon pixel detectors are at the core of the current and planned upgrade of the ATLAS detector at the Large Hadron Collider (LHC). As the closest detector component to the interaction point, these detectors will be subjected to a significant amount of radiation over their lifetime: prior to the High-Luminosity LHC (HL-LHC), the innermost layers will receive a fluence in excess of $10^{15} n_{eq}/cm^2$ and the HL-HLC detector upgrades must cope with an order of magnitude higher fluence integrated over their lifetimes. Simulating radiation damage is critical in order to make accurate predictions for current future detector performance that will enable searches for new particles and forces as well as precision measurements of Standard Model particles such as the Higgs boson. We present a digitization model that includes radiation damage effects to the ATLAS pixel sensors for the first time. In addition to thoroughly describing the setup, we present first predictions for basic pixel cluster properties alongside...

  19. Study of silicon pixel sensor for synchrotron radiation detection

    Science.gov (United States)

    Li, Zhen-Jie; Jia, Yun-Cong; Hu, Ling-Fei; Liu, Peng; Yin, Hua-Xiang

    2016-03-01

    The silicon pixel sensor (SPS) is one of the key components of hybrid pixel single-photon-counting detectors for synchrotron radiation X-ray detection (SRD). In this paper, the design, fabrication, and characterization of SPSs for single beam X-ray photon detection is reported. The designed pixel sensor is a p+-in-n structure with guard-ring structures operated in full-depletion mode and is fabricated on 4-inch, N type, 320 μm thick, high-resistivity silicon wafers by a general Si planar process. To achieve high energy resolution of X-rays and obtain low dark current and high breakdown voltage as well as appropriate depletion voltage of the SPS, a series of technical optimizations of device structure and fabrication process are explored. With optimized device structure and fabrication process, excellent SPS characteristics with dark current of 2 nA/cm2, full depletion voltage 150 V are achieved. The fabricated SPSs are wire bonded to ASIC circuits and tested for the performance of X-ray response to the 1W2B synchrotron beam line of the Beijing Synchrotron Radiation Facility. The measured S-curves for SRD demonstrate a high discrimination for different energy X-rays. The extracted energy resolution is high (10 keV) and the linear properties between input photo energy and the equivalent generator amplitude are well established. It confirmed that the fabricated SPSs have a good energy linearity and high count rate with the optimized technologies. The technology is expected to have a promising application in the development of a large scale SRD system for the Beijing Advanced Photon Source. Supported by Prefabrication Research of Beijing Advanced Photon Source (R&D for BAPS) and National Natural Science Foundation of China (11335010)

  20. From vertex detectors to inner trackers with CMOS pixel sensors

    Science.gov (United States)

    Besson, A.; Pérez, A. Pérez; Spiriti, E.; Baudot, J.; Claus, G.; Goffe, M.; Winter, M.

    2017-02-01

    The use of CMOS Pixel Sensors (CPS) for high resolution and low material vertex detectors has been validated with the 2014 and 2015 physics runs of the STAR-PXL detector at RHIC/BNL. This opens the door to the use of CPS for inner tracking devices, with 10-100 times larger sensitive area, which require therefore a sensor design privileging power saving, response uniformity and robustness. The 350 nm CMOS technology used for the STAR-PXL sensors was considered as too poorly suited to upcoming applications like the upgraded ALICE Inner Tracking System (ITS), which requires sensors with one order of magnitude improvement on readout speed and improved radiation tolerance. This triggered the exploration of a deeper sub-micron CMOS technology, Tower-Jazz 180 nm, for the design of a CPS well adapted for the new ALICE-ITS running conditions. This paper reports the R & D results for the conception of a CPS well adapted for the ALICE-ITS.

  1. From vertex detectors to inner trackers with CMOS pixel sensors

    CERN Document Server

    Besson, A; Spiriti, E.; Baudot, J.; Claus, G.; Goffe, M.; Winter, M.

    2016-01-01

    The use of CMOS Pixel Sensors (CPS) for high resolution and low material vertex detectors has been validated with the 2014 and 2015 physics runs of the STAR-PXL detector at RHIC/BNL. This opens the door to the use of CPS for inner tracking devices, with 10-100 times larger sensitive area, which require therefore a sensor design privileging power saving, response uniformity and robustness. The 350 nm CMOS technology used for the STAR-PXL sensors was considered as too poorly suited to upcoming applications like the upgraded ALICE Inner Tracking System (ITS), which requires sensors with one order of magnitude improvement on readout speed and improved radiation tolerance. This triggered the exploration of a deeper sub-micron CMOS technology, Tower-Jazz 180 nm, for the design of a CPS well adapted for the new ALICE-ITS running conditions. This paper reports the R&D results for the conception of a CPS well adapted for the ALICE-ITS.

  2. Microlens performance limits in sub-2mum pixel CMOS image sensors.

    Science.gov (United States)

    Huo, Yijie; Fesenmaier, Christian C; Catrysse, Peter B

    2010-03-15

    CMOS image sensors with smaller pixels are expected to enable digital imaging systems with better resolution. When pixel size scales below 2 mum, however, diffraction affects the optical performance of the pixel and its microlens, in particular. We present a first-principles electromagnetic analysis of microlens behavior during the lateral scaling of CMOS image sensor pixels. We establish for a three-metal-layer pixel that diffraction prevents the microlens from acting as a focusing element when pixels become smaller than 1.4 microm. This severely degrades performance for on and off-axis pixels in red, green and blue color channels. We predict that one-metal-layer or backside-illuminated pixels are required to extend the functionality of microlenses beyond the 1.4 microm pixel node.

  3. Active pixel sensors: the sensor of choice for future space applications

    NARCIS (Netherlands)

    Leijtens, J.; Theuwissen, A.; Rao, P.R.; Wang, X.; Xie, N.

    2007-01-01

    It is generally known that active pixel sensors (APS) have a number of advantages over CCD detectors if it comes to cost for mass production, power consumption and ease of integration. Nevertheless, most space applications still use CCD detectors because they tend to give better performance and have

  4. Design optimization of pixel sensors using device simulations for the phase-II CMS tracker upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Jain, G., E-mail: geetikajain.hep@gmail.com [CDRST, Department of Physics & Astrophysics, University of Delhi, Delhi (India); Bhardwaj, A.; Dalal, R. [CDRST, Department of Physics & Astrophysics, University of Delhi, Delhi (India); Eber, R. [Institute fur Experimentelle Kernphysik (Germany); Eichorn, T. [Deutsches Elektronen Synchrotron (Germany); Fernandez, M. [Instituto de Fisica de Cantabria (Spain); Lalwani, K. [CDRST, Department of Physics & Astrophysics, University of Delhi, Delhi (India); Messineo, A. [Universita di Pisa & INFN sez. di Pisa (Italy); Palomo, F.R. [Escuela Superior de Ingenieros, Universidad de Sevilla (Spain); Peltola, T. [Helsinki Institute of Physics (Finland); Printz, M. [Institute fur Experimentelle Kernphysik (Germany); Ranjan, K. [CDRST, Department of Physics & Astrophysics, University of Delhi, Delhi (India); Villa, I. [Instituto de Fisica de Cantabria (Spain); Hidalgo, S. [Instituto de Microelectronica de Barcelona, Centro Nacional de Microelectronica (Spain)

    2016-07-11

    In order to address the problems caused by the harsh radiation environment during the high luminosity phase of the LHC (HL-LHC), all silicon tracking detectors (pixels and strips) in the CMS experiment will undergo an upgrade. And so to develop radiation hard pixel sensors, simulations have been performed using the 2D TCAD device simulator, SILVACO, to obtain design parameters. The effect of various design parameters like pixel size, pixel depth, implant width, metal overhang, p-stop concentration, p-stop depth and bulk doping density on the leakage current and critical electric field are studied for both non-irradiated as well as irradiated pixel sensors. These 2D simulation results of planar pixels are useful for providing insight into the behaviour of non-irradiated and irradiated silicon pixel sensors and further work on 3D simulation is underway.

  5. Improvement to the signaling interface for CMOS pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Shi, Zhan, E-mail: sz1134@163.com [Dalian University of Technology, No.2 Linggong Road, 116024 Dalian (China); Tang, Zhenan, E-mail: tangza@dlut.edu.cn [Dalian University of Technology, No.2 Linggong Road, 116024 Dalian (China); Feng, Chong [Dalian University of Technology, No.2 Linggong Road, 116024 Dalian (China); Dalian Minzu University, No.18 Liaohe West Road, 116600 Dalian (China); Cai, Hong [Dalian University of Technology, No.2 Linggong Road, 116024 Dalian (China)

    2016-10-01

    The development of the readout speed of CMOS pixel sensors (CPS) is motivated by the demanding requirements of future high energy physics (HEP) experiments. As the interface between CPS and the data acquisition (DAQ) system, which inputs clock from the DAQ system and outputs data from CPS, the signaling interface should also be improved in terms of data rates. Meanwhile, the power consumption of the signaling interface should be maintained as low as possible. Consequently, a reduced swing differential signaling (RSDS) driver was adopted instead of a low-voltage differential signaling (LVDS) driver to transmit data from CPS to the DAQ system. In order to increase the capability of data rates, a serial source termination technique was employed. A LVDS/RSDS receiver was employed for transmitting clock from the DAQ system to CPS. A new method of generating hysteresis and a special current comparator were used to achieve a higher speed with lower power consumption. The signaling interface was designed and submitted for fabrication in a 0.18 µm CMOS image sensor (CIS) process. Measurement results indicate that the RSDS driver and the LVDS receiver can operate correctly at a data rate of 2 Gb/s with a power consumption of 19.1 mW.

  6. Improvement to the signaling interface for CMOS pixel sensors

    Science.gov (United States)

    Shi, Zhan; Tang, Zhenan; Feng, Chong; Cai, Hong

    2016-10-01

    The development of the readout speed of CMOS pixel sensors (CPS) is motivated by the demanding requirements of future high energy physics (HEP) experiments. As the interface between CPS and the data acquisition (DAQ) system, which inputs clock from the DAQ system and outputs data from CPS, the signaling interface should also be improved in terms of data rates. Meanwhile, the power consumption of the signaling interface should be maintained as low as possible. Consequently, a reduced swing differential signaling (RSDS) driver was adopted instead of a low-voltage differential signaling (LVDS) driver to transmit data from CPS to the DAQ system. In order to increase the capability of data rates, a serial source termination technique was employed. A LVDS/RSDS receiver was employed for transmitting clock from the DAQ system to CPS. A new method of generating hysteresis and a special current comparator were used to achieve a higher speed with lower power consumption. The signaling interface was designed and submitted for fabrication in a 0.18 μm CMOS image sensor (CIS) process. Measurement results indicate that the RSDS driver and the LVDS receiver can operate correctly at a data rate of 2 Gb/s with a power consumption of 19.1 mW.

  7. Transfer Function and Fluorescence Measurements on New CMOS Pixel Sensor for ATLAS

    CERN Document Server

    Kaemingk, Michael

    2017-01-01

    A new generation of pixel sensors is being designed for the phase II upgrade of the ATLAS Inner Tracker (ITk). These pixel sensors are being tested to ensure that they meet the demands of the ATLAS detector. As a summer student, I was involved in some of the measurements taken for this purpose.

  8. IV and CV curves for irradiated prototype BTeV silicon pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Maria R. Coluccia et al.

    2002-07-16

    The authors present IV and CV curves for irradiated prototype n{sup +}/n/p{sup +} silicon pixel sensors, intended for use in the BTeV experiment at Fermilab. They tested pixel sensors from various vendors and with two pixel isolation layouts: p-stop and p-spray. Results are based on exposure with 200 MeV protons up to 6 x 10{sup 14} protons/cm{sup 2}.

  9. 4T CMOS Active Pixel Sensors under Ionizing Radiation

    NARCIS (Netherlands)

    Tan, J.

    2013-01-01

    This thesis investigates the ionizing radiation effects on 4T pixels and the elementary in-pixel test devices with regard to the electrical performance and the optical performance. In addition to an analysis of the macroscopic pixel parameter degradation, the radiation-induced degradation mechanisms

  10. Active-Pixel Image Sensor With Analog-To-Digital Converters

    Science.gov (United States)

    Fossum, Eric R.; Mendis, Sunetra K.; Pain, Bedabrata; Nixon, Robert H.

    1995-01-01

    Proposed single-chip integrated-circuit image sensor contains 128 x 128 array of active pixel sensors at 50-micrometer pitch. Output terminals of all pixels in each given column connected to analog-to-digital (A/D) converter located at bottom of column. Pixels scanned in semiparallel fashion, one row at time; during time allocated to scanning row, outputs of all active pixel sensors in row fed to respective A/D converters. Design of chip based on complementary metal oxide semiconductor (CMOS) technology, and individual circuit elements fabricated according to 2-micrometer CMOS design rules. Active pixel sensors designed to operate at video rate of 30 frames/second, even at low light levels. A/D scheme based on first-order Sigma-Delta modulation.

  11. Electrical characterization of irradiated prototype silicon pixel sensors for BTeV

    Energy Technology Data Exchange (ETDEWEB)

    Maria Rita Coluccia et al.

    2002-11-13

    The pixel detector in the BteV experiment at the Tevatron (Fermi Laboratory) is an important detector component for high-resolution tracking and vertex identification. For this task the hybrid pixel detector has to work in a very harsh radiation environment with up to 10{sup 14} minimum ionizing particles/cm{sup 2}/year. Radiation hardness of prototype n{sup +}/n/p{sup +} silicon pixel sensors has been investigated. We present Electrical characterization curves for irradiated prototype n{sup +}/n/p{sup +} sensors, intended for use in the BTeV experiment. We tested pixel sensors from various vendors and with two pixel isolation techniques: p-stop and p-spray. Results are based on irradiation with 200 MeV protons up to 6 x 10{sup 14} protons/cm{sup 2}.

  12. Planar n{sup +}-in-n silicon pixel sensors for the ATLAS IBL upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Goessling, C.; Klingenberg, R. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Muenstermann, D., E-mail: Daniel.Muenstermann@TU-Dortmund.de [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Rummler, A.; Troska, G.; Wittig, T. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany)

    2011-09-11

    The ATLAS experiment at the LHC is planning to upgrade its pixel detector by the installation of a 4th pixel layer, the insertable b-layer IBL with a mean sensor radius of only 32 mm from the beam axis. Being very close to the beam, the radiation damage of the IBL sensors might be as high as 5x10{sup 15} n{sub eq} cm{sup -2} at their end-of-life. To investigate the radiation hardness and suitability of the current ATLAS pixel sensors for IBL fluences, n{sup +}-in-n silicon pixel sensors from the ATLAS Pixel production have been irradiated by reactor neutrons to the IBL design fluence and been tested with pions at the SPS and with electrons from a {sup 90}Sr source in the laboratory. The collected charge was found to exceed 10 000 electrons per MIP at 1 kV of bias voltage which is in agreement with data collected with strip sensors. With an expected threshold of 3000-4000 electrons, this result suggests that planar n{sup +}-in-n pixel sensors are radiation hard enough to be used as IBL sensor technology.

  13. A High-Speed CMOS Image Sensor with Global Electronic Shutter Pixels Using Pinned Diodes

    Science.gov (United States)

    Yasutomi, Keita; Tamura, Toshihiro; Furuta, Masanori; Itoh, Shinya; Kawahito, Shoji

    This paper describes a high-speed CMOS image sensor with a new type of global electronic shutter pixel. A global electronic shutter is necessary for imaging fast-moving objects without motion blur or distortion. The proposed pixel has two potential wells with pinned diode structure for two-stage charge transfer that enables a global electronic shuttering and reset noise canceling. A prototype high-speed image sensor fabricated in 0.18μm standard CMOS image sensor process consists of the proposed pixel array, 12-bit column-parallel cyclic ADC arrays and 192-channel digital outputs. The sensor achieves a good linearity at low-light intensity, demonstrating the perfect charge transfer between two pinned diodes. The input referred noise of the proposed pixel is measured to be 6.3 e-.

  14. A counting pixel chip and sensor system for X-ray imaging

    Energy Technology Data Exchange (ETDEWEB)

    Fischer, P.; Hausmann, J.; Helmich, A.; Lindner, M.; Wermes, N. [Universitaet Bonn (Germany). Physikalisches Institut; Blanquart, L. [CNRS, Marseille (France). Centre de Physique des Particules

    1999-08-01

    Results obtained with a (photon) counting pixel imaging chip connected to a silicon pixel sensor using the bump and flip-chip technology are presented. The performance of the chip electronics is characterized by an average equivalent noise charge (ENC) below 135 e and a threshold spread of less than 35 e after individual threshold adjust, both measured with a sensor attached. First results on the imaging performance are also reported.

  15. Comparing three spaceborne optical sensors via fine scale pixel ...

    African Journals Online (AJOL)

    User @

    Pixel-based Urban Land Cover Classification Products ... operational VHR spaceborne measurement systems such as those envisaged under ...... zone correlated vegetation stratification in the Kruger National Park, South Africa', Physics and.

  16. Design of a 3D-IC multi-resolution digital pixel sensor

    Science.gov (United States)

    Brochard, N.; Nebhen, J.; Dubois, J.; Ginhac, D.

    2016-04-01

    This paper presents a digital pixel sensor (DPS) integrating a sigma-delta analog-to-digital converter (ADC) at pixel level. The digital pixel includes a photodiode, a delta-sigma modulation and a digital decimation filter. It features adaptive dynamic range and multiple resolutions (up to 10-bit) with a high linearity. A specific row decoder and column decoder are also designed to permit to read a specific pixel chosen in the matrix and its neighborhood of 4 x 4. Finally, a complete design with the CMOS 130 nm 3D-IC FaStack Tezzaron technology is also described, revealing a high fill-factor of about 80%.

  17. Direct detection in Transmission Electron Microscopy with a 5{mu}m pitch CMOS pixel sensor

    Energy Technology Data Exchange (ETDEWEB)

    Contarato, Devis, E-mail: DContarato@lbl.go [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Denes, Peter; Doering, Dionisio; Joseph, John; Krieger, Brad [Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)

    2011-04-11

    This paper presents the characterization of a CMOS monolithic pixel sensor prototype optimized for direct detection in Transmission Electron Microscopy (TEM). The sensor was manufactured in a deep-submicron commercial CMOS process and features pixels of 5{mu}m pitch. Different pixel architectures have been implemented in the test chip, and the best performing architecture has been selected from a series of tests performed with 300 keV electrons. Irradiation tests to high electron doses have also been performed in order to estimate device lifetime.

  18. Achievements of the ATLAS Upgrade Planar Pixel Sensors R&D Project

    CERN Document Server

    Nellist, C

    2015-01-01

    In the framework of the HL-LHC upgrade, the ATLAS experiment plans to introduce an all-silicon inner tracker to cope with the elevated occupancy. To investigate the suitability of pixel sensors using the proven planar technology for the upgraded tracker, the ATLAS Planar Pixel Sensor R&D Project (PPS) was established comprising 19 institutes and more than 90 scientists. The paper provides an overview of the research and development project and highlights accomplishments, among them: beam test results with planar sensors up to innermost layer fluences (> 10^16 n_eq cm^2); measurements obtained with irradiated thin edgeless n-in-p pixel assemblies; recent studies of the SCP technique to obtain almost active edges by postprocessing already existing sensors based on scribing, cleaving and edge passivation; an update on prototyping efforts for large areas: sensor design improvements and concepts for low-cost hybridisation; comparison between Secondary Ion Mass Spectrometry results and TCAD simulations. Togethe...

  19. Design, optimization and evaluation of a "smart" pixel sensor array for low-dose digital radiography

    Science.gov (United States)

    Wang, Kai; Liu, Xinghui; Ou, Hai; Chen, Jun

    2016-04-01

    Amorphous silicon (a-Si:H) thin-film transistors (TFTs) have been widely used to build flat-panel X-ray detectors for digital radiography (DR). As the demand for low-dose X-ray imaging grows, a detector with high signal-to-noise-ratio (SNR) pixel architecture emerges. "Smart" pixel is intended to use a dual-gate photosensitive TFT for sensing, storage, and switch. It differs from a conventional passive pixel sensor (PPS) and active pixel sensor (APS) in that all these three functions are combined into one device instead of three separate units in a pixel. Thus, it is expected to have high fill factor and high spatial resolution. In addition, it utilizes the amplification effect of the dual-gate photosensitive TFT to form a one-transistor APS that leads to a potentially high SNR. This paper addresses the design, optimization and evaluation of the smart pixel sensor and array for low-dose DR. We will design and optimize the smart pixel from the scintillator to TFT levels and validate it through optical and electrical simulation and experiments of a 4x4 sensor array.

  20. Simulations of 3D-Si sensors for the innermost layer of the ATLAS pixel upgrade

    CERN Document Server

    Baselga, Marta

    2017-01-01

    The LHC is expected to reach luminosities up to 3000fb-1 and the innermost layer of the ATLAS upgrade plans to cope with higher occupancy and to decrease the pixel size. 3D-Si sensors are a good candidate for the innermost layer of the ATLAS pixel upgrade since they exhibit good performance under high fluences and the new designs will have smaller pixel size to fulfill the electronics expectations. This paper reports TCAD simulations of the 3D-Si sensors designed at IMB-CNM with non passing-through columns that are being fabricated for the next innermost layer of the ATLAS pixel upgrade, shows the charge collection response before and after irradiation, and the response of 3D-Si sensors located at large $\\eta$ angles.

  1. Simulations of 3D-Si sensors for the innermost layer of the ATLAS pixel upgrade

    Science.gov (United States)

    Baselga, M.; Pellegrini, G.; Quirion, D.

    2017-03-01

    The LHC is expected to reach luminosities up to 3000 fb-1 and the innermost layer of the ATLAS upgrade plans to cope with higher occupancy and to decrease the pixel size. 3D-Si sensors are a good candidate for the innermost layer of the ATLAS pixel upgrade since they exhibit good performance under high fluences and the new designs will have smaller pixel size to fulfill the electronics expectations. This paper reports TCAD simulations of the 3D-Si sensors designed at IMB-CNM with non-passing-through columns that are being fabricated for the next innermost layer of the ATLAS pixel upgrade. It shows the charge collection response before and after irradiation, and the response of 3D-Si sensors located at large η angles.

  2. Test Beam Results of 3D Silicon Pixel Sensors for the ATLAS upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Grenier, P.; /SLAC; Alimonti, G.; /INFN, Milan; Barbero, M.; /Bonn U.; Bates, R.; /Glasgow U.; Bolle, E.; /Oslo U.; Borri, M.; /Manchester U.; Boscardin, M.; /Fond. Bruno Kessler, Povo; Buttar, C.; /Glasgow U.; Capua, M.; /Calabria U. /INFN, Cosenza; Cavalli-Sforza, M.; /Barcelona, IFAE; Cobal, M.; /Udine U. /INFN, Udine; Cristofoli, A.; /Udine U. /INFN, Udine; Dalla Betta, G.F.; /Trento U. /INFN, Trento; Darbo, G.; /INFN, Genoa; Da Via, C.; /Manchester U.; Devetak, E.; /SUNY, Stony Brook; DeWilde, B.; /SUNY, Stony Brook; Di Girolamo, B.; /CERN; Dobos, D.; /CERN; Einsweiler, K.; /LBL, Berkeley; Esseni, D.; /Udine U. /INFN, Udine /Calabria U. /INFN, Cosenza /Barcelona, Inst. Microelectron. /Manchester U. /CERN /LBL, Berkeley /INFN, Genoa /INFN, Genoa /Udine U. /INFN, Udine /Oslo U. /ICREA, Barcelona /Barcelona, IFAE /SINTEF, Oslo /SINTEF, Oslo /SLAC /SLAC /Bergen U. /New Mexico U. /Bonn U. /SLAC /Freiburg U. /VTT Electronics, Espoo /Bonn U. /SLAC /Freiburg U. /SLAC /SINTEF, Oslo /Manchester U. /Barcelona, IFAE /Bonn U. /Bonn U. /CERN /Manchester U. /SINTEF, Oslo /Barcelona, Inst. Microelectron. /Calabria U. /INFN, Cosenza /Udine U. /INFN, Udine /Manchester U. /VTT Electronics, Espoo /Glasgow U. /Barcelona, IFAE /Udine U. /INFN, Udine /Hawaii U. /Freiburg U. /Manchester U. /Barcelona, Inst. Microelectron. /CERN /Fond. Bruno Kessler, Povo /Prague, Tech. U. /Trento U. /INFN, Trento /CERN /Oslo U. /Fond. Bruno Kessler, Povo /INFN, Genoa /INFN, Genoa /Bergen U. /New Mexico U. /Udine U. /INFN, Udine /SLAC /Oslo U. /Prague, Tech. U. /Oslo U. /Bergen U. /SUNY, Stony Brook /SLAC /Calabria U. /INFN, Cosenza /Manchester U. /Bonn U. /SUNY, Stony Brook /Manchester U. /Bonn U. /SLAC /Fond. Bruno Kessler, Povo

    2011-08-19

    Results on beam tests of 3D silicon pixel sensors aimed at the ATLAS Insertable-B-Layer and High Luminosity LHC (HL-LHC) upgrades are presented. Measurements include charge collection, tracking efficiency and charge sharing between pixel cells, as a function of track incident angle, and were performed with and without a 1.6 T magnetic field oriented as the ATLAS Inner Detector solenoid field. Sensors were bump bonded to the front-end chip currently used in the ATLAS pixel detector. Full 3D sensors, with electrodes penetrating through the entire wafer thickness and active edge, and double-sided 3D sensors with partially overlapping bias and read-out electrodes were tested and showed comparable performance. Full and partial 3D pixel detectors have been tested, with and without a 1.6T magnetic field, in high energy pion beams at the CERN SPS North Area in 2009. Sensors characteristics have been measured as a function of the beam incident angle and compared to a regular planar pixel device. Overall full and partial 3D devices have similar behavior. Magnetic field has no sizeable effect on 3D performances. Due to electrode inefficiency 3D devices exhibit some loss of tracking efficiency for normal incident tracks but recover full efficiency with tilted tracks. As expected due to the electric field configuration 3D sensors have little charge sharing between cells.

  3. Development of radiation hard CMOS active pixel sensors for HL-LHC

    Energy Technology Data Exchange (ETDEWEB)

    Pernegger, Heinz, E-mail: heinz.pernegger@cern.ch

    2016-07-11

    New pixel detectors, based on commercial high voltage and/or high resistivity full CMOS processes, hold promise as next-generation active pixel sensors for inner and intermediate layers of the upgraded ATLAS tracker. The use of commercial CMOS processes allow cost-effective detector construction and simpler hybridisation techniques. The paper gives an overview of the results obtained on AMS-produced CMOS sensors coupled to the ATLAS Pixel FE-I4 readout chips. The SOI (silicon-on-insulator) produced sensors by XFAB hold great promise as radiation hard SOI-CMOS sensors due to their combination of partially depleted SOI transistors reducing back-gate effects. The test results include pre-/post-irradiation comparison, measurements of charge collection regions as well as test beam results.

  4. Test beam results of 3D silicon pixel sensors for the ATLAS upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Grenier, P., E-mail: grenier@slac.stanford.ed [SLAC National Accelerator Laboratory (United States); Alimonti, G. [INFN Sezione di Milano (Italy); Barbero, M. [Bonn University (Germany); Bates, R. [Glasgow University (United Kingdom); Bolle, E. [Oslo University (Norway); Borri, M. [University of Manchester (United Kingdom); Boscardin, M. [FBK-irst, Trento (Italy); Buttar, C. [Glasgow University (United Kingdom); Capua, M. [INFN Gruppo Collegato di Cosenza and Universita della Calabria (Italy); Cavalli-Sforza, M. [IFAE Barcelona (Spain); Cobal, M.; Cristofoli, A. [INFN Gruppo Collegato di Udine and Universita di Udine (Italy); Dalla Betta, G.-F. [INFN Gruppo Collegato di Trento and DISI Universita di Trento (Italy); Darbo, G. [INFN Sezione di Genova (Italy); Da Via, C. [University of Manchester (United Kingdom); Devetak, E.; DeWilde, B. [Stony Brook University (United States); Di Girolamo, B.; Dobos, D. [CERN (Switzerland); Einsweiler, K. [Lawrence Berkeley National Laboratory (United States)

    2011-05-11

    Results on beam tests of 3D silicon pixel sensors aimed at the ATLAS Insertable B-Layer and High Luminosity LHC (HL-LHC) upgrades are presented. Measurements include charge collection, tracking efficiency and charge sharing between pixel cells, as a function of track incident angle, and were performed with and without a 1.6 T magnetic field oriented as the ATLAS inner detector solenoid field. Sensors were bump-bonded to the front-end chip currently used in the ATLAS pixel detector. Full 3D sensors, with electrodes penetrating through the entire wafer thickness and active edge, and double-sided 3D sensors with partially overlapping bias and read-out electrodes were tested and showed comparable performance.

  5. 320×240 Pixels CMOS Digital Image Sensor with Wide Dynamic Range

    Institute of Scientific and Technical Information of China (English)

    FANG Jie; WANG Jing-guang; HONG Zhi-liang

    2004-01-01

    A 320×240 CMOS image sensor is demonstrated,which is implemented by a standard 0.6 μm 2P2M CMOS process.For reducing the chip area,each 2×2-pixel block shares a sample/hold circuit,analog-to-digital converter and 1-b memory.The 2×2 pixel pitch has an area of 40 μm×40 μm and the fill factor is about 16%.While operating at a low frame rate,the sensor dissipates a very low power by power-management circuit making pixel-level comparators in an idle state.A digital correlated double sampling,which eliminates fixed pattern noise,improves SNR of the sensor, and multiple sampling operations make the sensor have a wide dynamic range.

  6. Electron Pattern Recognition using trigger mode SOI pixel sensor for Advanced Compton Imaging

    Science.gov (United States)

    Shimazoe, K.; Yoshihara, Y.; Fairuz, A.; Koyama, A.; Takahashi, H.; Takeda, A.; Tsuru, T.; Arai, Y.

    2016-02-01

    Compton imaging is a useful method for localizing sub MeV to a few MeV gamma-rays and widely used for environmental and medical applications. The direction of recoiled electrons in Compton scattering process provides the additional information to limit the Compton cones and increases the sensitivity in the system. The capability of recoiled electron tracking using trigger-mode Silicon-On-Insulator (SOI) sensor is investigated with various radiation sources. The trigger-mode SOI sensor consists of 144 by 144 active pixels with 30 μm cells and the thickness of sensor is 500 μm. The sensor generates the digital output when it is hit by gamma-rays and 25 by 25 pixel pattern of surrounding the triggered pixel is readout to extract the recoiled electron track. The electron track is successfully observed for 60Co and 137Cs sources, which provides useful information for future electron tracking Compton camera.

  7. Test Beam Results of 3D Silicon Pixel Sensors for the ATLAS upgrade

    CERN Document Server

    Grenier, P; Barbero, M; Bates, R; Bolle, E; Borri, M; Boscardin, M; Buttar, C; Capua, M; Cavalli-Sforza, M; Cobal, M; Cristofoli, A; Dalla Betta, G F; Darbo, G; Da Via, C; Devetak, E; DeWilde, B; Di Girolamo, B; Dobos, D; Einsweiler, K; Esseni, D; Fazio, S; Fleta, C; Freestone, J; Gallrapp, C; Garcia-Sciveres, M; Gariano, G; Gemme, C; Giordani, M P; Gjersdal, H; Grinstein, S; Hansen, T; Hansen, T E; Hansson, P; Hasi, J; Helle, K; Hoeferkamp, M; Hugging, F; Jackson, P; Jakobs, K; Kalliopuska, J; Karagounis, M; Kenney, C; Köhler, M; Kocian, M; Kok, A; Kolya, S; Korokolov, I; Kostyukhin, V; Krüger, H; La Rosa, A; Lai, C H; Lietaer, N; Lozano, M; Mastroberardino, A; Micelli, A; Nellist, C; Oja, A; Oshea, V; Padilla, C; Palestri, P; Parker, S; Parzefall, U; Pater, J; Pellegrini, G; Pernegger, H; Piemonte, C; Pospisil, S; Povoli, M; Roe, S; Rohne, O; Ronchin, S; Rovani, A; Ruscino, E; Sandaker, H; Seidel, S; Selmi, L; Silverstein, D; Sjøbaek, K; Slavicek, T; Stapnes, S; Stugu, B; Stupak, J; Su, D; Susinno, G; Thompson, R; Tsung, J W; Tsybychev, D; Watts, S J; Wermes, N; Young, C; Zorzi, N

    2011-01-01

    Results on beam tests of 3D silicon pixel sensors aimed at the ATLAS Insertable-B-Layer and High Luminosity LHC (HL-LHC)) upgrades are presented. Measurements include charge collection, tracking efficiency and charge sharing between pixel cells, as a function of track incident angle, and were performed with and without a 1.6 T magnetic field oriented as the ATLAS Inner Detector solenoid field. Sensors were bump bonded to the front-end chip currently used in the ATLAS pixel detector. Full 3D sensors, with electrodes penetrating through the entire wafer thickness and active edge, and double-sided 3D sensors with partially overlapping bias and read-out electrodes were tested and showed comparable performance.

  8. Small pixel cross-talk MTF and its impact on MWIR sensor performance

    Science.gov (United States)

    Goss, Tristan M.; Willers, Cornelius J.

    2017-05-01

    As pixel sizes reduce in the development of modern High Definition (HD) Mid Wave Infrared (MWIR) detectors the interpixel cross-talk becomes increasingly difficult to regulate. The diffusion lengths required to achieve the quantum efficiency and sensitivity of MWIR detectors are typically longer than the pixel pitch dimension, and the probability of inter-pixel cross-talk increases as the pixel pitch/diffusion length fraction decreases. Inter-pixel cross-talk is most conveniently quantified by the focal plane array sampling Modulation Transfer Function (MTF). Cross-talk MTF will reduce the ideal sinc square pixel MTF that is commonly used when modelling sensor performance. However, cross-talk MTF data is not always readily available from detector suppliers, and since the origins of inter-pixel cross-talk are uniquely device and manufacturing process specific, no generic MTF models appear to satisfy the needs of the sensor designers and analysts. In this paper cross-talk MTF data has been collected from recent publications and the development for a generic cross-talk MTF model to fit this data is investigated. The resulting cross-talk MTF model is then included in a MWIR sensor model and the impact on sensor performance is evaluated in terms of the National Imagery Interoperability Rating Scale's (NIIRS) General Image Quality Equation (GIQE) metric for a range of fnumber/ detector pitch Fλ/d configurations and operating environments. By applying non-linear boost transfer functions in the signal processing chain, the contrast losses due to cross-talk may be compensated for. Boost transfer functions, however, also reduce the signal to noise ratio of the sensor. In this paper boost function limits are investigated and included in the sensor performance assessments.

  9. Fast Contour-Tracing Algorithm Based on a Pixel-Following Method for Image Sensors.

    Science.gov (United States)

    Seo, Jonghoon; Chae, Seungho; Shim, Jinwook; Kim, Dongchul; Cheong, Cheolho; Han, Tack-Don

    2016-03-09

    Contour pixels distinguish objects from the background. Tracing and extracting contour pixels are widely used for smart/wearable image sensor devices, because these are simple and useful for detecting objects. In this paper, we present a novel contour-tracing algorithm for fast and accurate contour following. The proposed algorithm classifies the type of contour pixel, based on its local pattern. Then, it traces the next contour using the previous pixel's type. Therefore, it can classify the type of contour pixels as a straight line, inner corner, outer corner and inner-outer corner, and it can extract pixels of a specific contour type. Moreover, it can trace contour pixels rapidly because it can determine the local minimal path using the contour case. In addition, the proposed algorithm is capable of the compressing data of contour pixels using the representative points and inner-outer corner points, and it can accurately restore the contour image from the data. To compare the performance of the proposed algorithm to that of conventional techniques, we measure their processing time and accuracy. In the experimental results, the proposed algorithm shows better performance compared to the others. Furthermore, it can provide the compressed data of contour pixels and restore them accurately, including the inner-outer corner, which cannot be restored using conventional algorithms.

  10. A high fill-factor low dark leakage CMOS image sensor with shared-pixel design

    Science.gov (United States)

    Seo, Min-Woong; Yasutomi, Keita; Kagawa, Keiichiro; Kawahito, Shoji

    2014-03-01

    We have developed and evaluated the high responsivity and low dark leakage CMOS image sensor with the ring-gate shared-pixel design. A ring-gate shared-pixel design with a high fill factor makes it possible to achieve the low-light imaging. As eliminating the shallow trench isolation in the proposed pixel, the dark leakage current is significantly decreased because one of major dark leakage sources is removed. By sharing the in-pixel transistors such as a reset transistor, a select transistor, and a source follower amplifier, each pixel has a high fill-factor of 43 % and high sensitivity of 144.6 ke-/lx·sec. In addition, the effective number of transistors per pixel is 1.75. The proposed imager achieved the relatively low dark leakage current of about 104.5 e-/s (median at 60°C), corresponding to a dark current density Jdark_proposed of about 30 pA/cm2. In contrast, the conventional type test pixel has a large dark leakage current of 2450 e-/s (median at 60°C), corresponding to Jdark_conventional of about 700 pA/cm2. Both pixels have a same pixel size of 7.5×7.5 μm2 and are fabricated in same process.

  11. Pixel parallel localized driver design for a 128 x 256 pixel array 3D 1Gfps image sensor

    Science.gov (United States)

    Zhang, C.; Dao, V. T. S.; Etoh, T. G.; Charbon, E.

    2017-02-01

    In this paper, a 3D 1Gfps BSI image sensor is proposed, where 128 × 256 pixels are located in the top-tier chip and a 32 × 32 localized driver array in the bottom-tier chip. Pixels are designed with Multiple Collection Gates (MCG), which collects photons selectively with different collection gates being active at intervals of 1ns to achieve 1Gfps. For the drivers, a global PLL is designed, which consists of a ring oscillator with 6-stage current starved differential inverters, achieving a wide frequency tuning range from 40MHz to 360MHz (20ps rms jitter). The drivers are the replicas of the ring oscillator that operates within a PLL. Together with level shifters and XNOR gates, continuous 3.3V pulses are generated with desired pulse width, which is 1/12 of the PLL clock period. The driver array is activated by a START signal, which propagates through a highly balanced clock tree, to activate all the pixels at the same time with virtually negligible skew.

  12. Silicon Sensors for the Upgrades of the CMS Pixel Detector

    CERN Document Server

    Centis Vignali, Matteo; Schleper, Peter

    2015-01-01

    The Compact Muon Solenoid (CMS) is a general purpose detector at the Large Hadron Collider (LHC). The LHC luminosity is constantly increased through upgrades of the accel- erator and its injection chain. Two major upgrades will take place in the next years. The rst upgrade involves the LHC injector chain and allows the collider to achieve a luminosity of about 2 10 34 cm-2 s-1 A further upgrade of the LHC foreseen for 2025 will boost its luminosity to 5 10 34 cm-2 s1. As a consequence of the increased luminosity, the detectors need to be upgraded. In particular, the CMS pixel detector will undergo two upgrades in the next years. The rst upgrade (phase I) consists in the substitution of the current pixel detector in winter 2016/2017. The upgraded pixel detector will implement new readout elec- tronics that allow ecient data taking up to a luminosity of 2 10 34 cm-2s-1,twice as much as the LHC design luminosity. The modules that will constitute the upgraded detector are being produced at dierent institutes. Ham...

  13. First tests of CHERWELL, a Monolithic Active Pixel Sensor: A CMOS Image Sensor (CIS) using 180 nm technology

    Energy Technology Data Exchange (ETDEWEB)

    Mylroie-Smith, James, E-mail: j.mylroie-smith@qmul.ac.uk [Queen Mary, University of London (United Kingdom); Kolya, Scott; Velthuis, Jaap [University of Bristol (United Kingdom); Bevan, Adrian; Inguglia, Gianluca [Queen Mary, University of London (United Kingdom); Headspith, Jon; Lazarus, Ian; Lemon, Roy [Daresbury Laboratory, STFC (United Kingdom); Crooks, Jamie; Turchetta, Renato; Wilson, Fergus [Rutherford Appleton Laboratory, STFC (United Kingdom)

    2013-12-11

    The Cherwell is a 4T CMOS sensor in 180 nm technology developed for the detection of charged particles. Here, the different test structures on the sensor will be described and first results from tests on the reference pixel variant are shown. The sensors were shown to have a noise of 12 e{sup −} and a signal to noise up to 150 in {sup 55}Fe.

  14. Polymer pixel enhancement by laser-induced forward transfer for sensor applications

    Science.gov (United States)

    Dinca, V.; Palla-Papavlu, A.; Dinescu, M.; Shaw Stewart, J.; Lippert, T. K.; di Pietrantonio, F.; Cannata, D.; Benetti, M.; Verona, E.

    2010-11-01

    This paper presents polymer pixel printing for applications in chemoselective sensors where nanosecond laser direct transfer methods, with a triazene polymer (TP) acting as a Dynamic Release Layer (DRL), are used. A systematic study of laser fluence, donor film morphology and both single- and multiple-pixel deposition were optimized with the final goal to obtain continuous pixels of sensitive polymers, polyethylenimine (PEI) and polyisobutylene (PIB), on SAW surfaces. Morphology characterization after the laser transfer has been performed by Optical Microscopy and Scanning Electron Microscopy (SEM). The responses of the coated transducers were measured after deposition with different laser fluences and it was found that a fluence under 625 mJ/cm2 was required in order to prevent damage of the interdigital transducers (IDT) of the sensor devices. The sensitivity of the polymer coated devices to acetone concentrations gives an indication that LIFT can be used for printing sensitive polymer pixels onto transducer devices.

  15. Design and characterization of novel monolithic pixel sensors for the ALICE ITS upgrade

    Science.gov (United States)

    Cavicchioli, C.; Chalmet, P. L.; Giubilato, P.; Hillemanns, H.; Junique, A.; Kugathasan, T.; Mager, M.; Marin Tobon, C. A.; Martinengo, P.; Mattiazzo, S.; Mugnier, H.; Musa, L.; Pantano, D.; Rousset, J.; Reidt, F.; Riedler, P.; Snoeys, W.; Van Hoorne, J. W.; Yang, P.

    2014-11-01

    Within the R&D activities for the upgrade of the ALICE Inner Tracking System (ITS), Monolithic Active Pixel Sensors (MAPS) are being developed and studied, due to their lower material budget ( 0.3 %X0 in total for each inner layer) and higher granularity ( 20 μm × 20 μm pixels) with respect to the present pixel detector. This paper presents the design and characterization results of the Explorer0 chip, manufactured in the TowerJazz 180 nm CMOS Imaging Sensor process, based on a wafer with high-resistivity (ρ > 1 kΩ cm) and 18 μm thick epitaxial layer. The chip is organized in two sub-matrices with different pixel pitches (20 μm and 30 μm), each of them containing several pixel designs. The collection electrode size and shape, as well as the distance between the electrode and the surrounding electronics, are varied; the chip also offers the possibility to decouple the charge integration time from the readout time, and to change the sensor bias. The charge collection properties of the different pixel variants implemented in Explorer0 have been studied using a 55Fe X-ray source and 1-5 GeV/c electrons and positrons. The sensor capacitance has been estimated, and the effect of the sensor bias has also been examined in detail. A second version of the Explorer0 chip (called Explorer1) has been submitted for production in March 2013, together with a novel circuit with in-pixel discrimination and a sparsified readout. Results from these submissions are also presented.

  16. ALPIDE, the Monolithic Active Pixel Sensor for the ALICE ITS upgrade

    Science.gov (United States)

    Mager, M.

    2016-07-01

    A new 10 m2 inner tracking system based on seven concentric layers of Monolithic Active Pixel Sensors will be installed in the ALICE experiment during the second long shutdown of LHC in 2019-2020. The monolithic pixel sensors will be fabricated in the 180 nm CMOS Imaging Sensor process of TowerJazz. The ALPIDE design takes full advantage of a particular process feature, the deep p-well, which allows for full CMOS circuitry within the pixel matrix, while at the same time retaining the full charge collection efficiency. Together with the small feature size and the availability of six metal layers, this allowed a continuously active low-power front-end to be placed into each pixel and an in-matrix sparsification circuit to be used that sends only the addresses of hit pixels to the periphery. This approach led to a power consumption of less than 40 mWcm-2, a spatial resolution of around 5 μm, a peaking time of around 2 μs, while being radiation hard to some 1013 1 MeVneq /cm2, fulfilling or exceeding the ALICE requirements. Over the last years of R & D, several prototype circuits have been used to verify radiation hardness, and to optimize pixel geometry and in-pixel front-end circuitry. The positive results led to a submission of full-scale (3 cm×1.5 cm) sensor prototypes in 2014. They are being characterized in a comprehensive campaign that also involves several irradiation and beam tests. A summary of the results obtained and prospects towards the final sensor to instrument the ALICE Inner Tracking System are given.

  17. Development of Kilo-Pixel Arrays of Transition-Edge Sensors for X-Ray Spectroscopy

    Science.gov (United States)

    Adams, J. S.; Bandler, S. R.; Busch, S. E.; Chervenak, J. A.; Chiao, M. P.; Eckart, M. E.; Ewin, A. J.; Finkbeiner, F. M.; Kelley, R. L.; Kelly, D. P.; Kilbourne, C. A.; Leutenegger, M. A.; Porst, J.-P.; Porter, F. S.; Ray, C. A.; Sadleir, J. E.; Smith, S. J.; Wassell, E. J.; Doriese, W. B.; Fowler, J. W.; Hilton, G. C.; Irwin, K. D.; Reintsema, C. D.; Smith, D. R.; Swetz, D. S.

    2012-01-01

    We are developing kilo-pixel arrays of transition-edge sensor (TES) microcalorimeters for future X-ray astronomy observatories or for use in laboratory astrophysics applications. For example, Athena/XMS (currently under study by the european space agency) would require a close-packed 32x32 pixel array on a 250-micron pitch with pixel/second. We present characterization of 32x32 arrays. These detectors will be readout using state of the art SQUID based time-domain multiplexing (TDM). We will also present the latest results in integrating these detectors and the TDM readout technology into a 16 row x N column field-able instrument.

  18. Optimization of radiation hardness and charge collection of edgeless silicon pixel sensors for photon science

    CERN Document Server

    Zhang, Jiaguo; Pennicard, David; Sarajlic, Milija; Graafsma, Heinz

    2014-01-01

    Recent progress in active-edge technology of silicon sensors enables the development of large-area tiled silicon pixel detectors with small dead space between modules by utilizing edgeless sensors. Such technology has been proven in successful productions of ATLAS and Medipix-based silicon pixel sensors by a few foundries. However, the drawbacks of edgeless sensors are poor radiation hardness for ionizing radiation and non-uniform charge collection by edge pixels. In this work, the radiation hardness of edgeless sensors with different polarities has been investigated using Synopsys TCAD with X-ray radiation-damage parameters implemented. Results show that if no conventional guard ring is present, none of the current designs are able to achieve a high breakdown voltage (typically < 30 V) after irradiation to a dose of ~10 MGy. In addition, a charge-collection model has been developed and was used to calculate the charges collected by the edge pixels of edgeless sensors when illuminated with X-rays. The mode...

  19. A Low-Noise CMOS Pixel Direct Charge Sensor, Topmetal-II-

    CERN Document Server

    An, Mangmang; Gao, Chaosong; Han, Mikyung; Ji, Rong; Li, Xiaoting; Mei, Yuan; Sun, Quan; Sun, Xiangming; Wang, Kai; Xiao, Le; Xu, Nu; Yang, Ping; Zhou, Wei

    2016-01-01

    We report the design and characterization of a CMOS pixel direct charge sensor, Topmetal-II-, fabricated in a standard 0.35um CMOS Integrated Circuit process. The sensor utilizes exposed metal patches on top of each pixel to directly collect charge. Each pixel contains a low-noise charge-sensitive preamplifier to establish the analog signal and a discriminator with tunable threshold to generate hits. The analog signal from each pixel is accessible through time-shared multiplexing over the entire array. Hits are read out digitally through a column-based priority logic structure. Tests show that the sensor achieved a <15e- analog noise and a 200e- minimum threshold for digital readout per pixel. The sensor is capable of detecting both electrons and ions drifting in gas. These characteristics enable its use as the charge readout device in future Time Projection Chambers without gaseous gain mechanism, which has unique advantages in low background and low rate-density experiments.

  20. A low-noise CMOS pixel direct charge sensor, Topmetal-II-

    Science.gov (United States)

    An, Mangmang; Chen, Chufeng; Gao, Chaosong; Han, Mikyung; Ji, Rong; Li, Xiaoting; Mei, Yuan; Sun, Quan; Sun, Xiangming; Wang, Kai; Xiao, Le; Yang, Ping; Zhou, Wei

    2016-02-01

    We report the design and characterization of a CMOS pixel direct charge sensor, Topmetal-II-, fabricated in a standard 0.35 μm CMOS Integrated Circuit process. The sensor utilizes exposed metal patches on top of each pixel to directly collect charge. Each pixel contains a low-noise charge-sensitive preamplifier to establish the analog signal and a discriminator with tunable threshold to generate hits. The analog signal from each pixel is accessible through time-shared multiplexing over the entire array. Hits are read out digitally through a column-based priority logic structure. Tests show that the sensor achieved a analog noise and a 200e- minimum threshold for digital readout per pixel. The sensor is capable of detecting both electrons and ions drifting in gas. These characteristics enable its use as the charge readout device in future Time Projection Chambers without gaseous gain mechanism, which has unique advantages in low background and low rate-density experiments.

  1. Fast Contour-Tracing Algorithm Based on a Pixel-Following Method for Image Sensors

    Directory of Open Access Journals (Sweden)

    Jonghoon Seo

    2016-03-01

    Full Text Available Contour pixels distinguish objects from the background. Tracing and extracting contour pixels are widely used for smart/wearable image sensor devices, because these are simple and useful for detecting objects. In this paper, we present a novel contour-tracing algorithm for fast and accurate contour following. The proposed algorithm classifies the type of contour pixel, based on its local pattern. Then, it traces the next contour using the previous pixel’s type. Therefore, it can classify the type of contour pixels as a straight line, inner corner, outer corner and inner-outer corner, and it can extract pixels of a specific contour type. Moreover, it can trace contour pixels rapidly because it can determine the local minimal path using the contour case. In addition, the proposed algorithm is capable of the compressing data of contour pixels using the representative points and inner-outer corner points, and it can accurately restore the contour image from the data. To compare the performance of the proposed algorithm to that of conventional techniques, we measure their processing time and accuracy. In the experimental results, the proposed algorithm shows better performance compared to the others. Furthermore, it can provide the compressed data of contour pixels and restore them accurately, including the inner-outer corner, which cannot be restored using conventional algorithms.

  2. Probing and irradiation tests of ALICE pixel chip wafers and sensors

    CERN Document Server

    Cinausero, M; Antinori, F; Chochula, P; Dinapoli, R; Dima, R; Fabris, D; Galet, G; Lunardon, M; Manea, C; Marchini, S; Martini, S; Moretto, S; Pepato, Adriano; Prete, G; Riedler, P; Scarlassara, F; Segato, G F; Soramel, F; Stefanini, G; Turrisi, R; Vannucci, L; Viesti, G

    2004-01-01

    In the framework of the ALICE Silicon Pixel Detector (SPD) project a system dedicated to the tests of the ALICE1LHCb chip wafers has been assembled and is now in use for the selection of pixel chips to be bump-bonded to sensor ladders. In parallel, radiation hardness tests of the SPD silicon sensors have been carried out using the 27 MeV proton beam delivered by the XTU TANDEM accelerator at the SIRAD facility in LNL. In this paper we describe the wafer probing and irradiation set-ups and we report the obtained results. (6 refs).

  3. Development of a pixel sensor with fine space-time resolution based on SOI technology for the ILC vertex detector

    Science.gov (United States)

    Ono, Shun; Togawa, Manabu; Tsuji, Ryoji; Mori, Teppei; Yamada, Miho; Arai, Yasuo; Tsuboyama, Toru; Hanagaki, Kazunori

    2017-02-01

    We have been developing a new monolithic pixel sensor with silicon-on-insulator (SOI) technology for the International Linear Collider (ILC) vertex detector system. The SOI monolithic pixel detector is realized using standard CMOS circuits fabricated on a fully depleted sensor layer. The new SOI sensor SOFIST can store both the position and timing information of charged particles in each 20×20 μm2 pixel. The position resolution is further improved by the position weighted with the charges spread to multiple pixels. The pixel also records the hit timing with an embedded time-stamp circuit. The sensor chip has column-parallel analog-to-digital conversion (ADC) circuits and zero-suppression logic for high-speed data readout. We are designing and evaluating some prototype sensor chips for optimizing and minimizing the pixel circuit.

  4. Characterization of proton irradiated 3D-DDTC pixel sensor prototypes fabricated at FBK

    Energy Technology Data Exchange (ETDEWEB)

    La Rosa, A., E-mail: alessandro.larosa@cern.ch [CERN, Geneva 23, CH-1211 (Switzerland); Boscardin, M. [Fondazione Bruno Kessler, FBK-CMM, Via Sommarive 18, I-38123 Trento (Italy); Cobal, M. [Universita degli Studi di Udine and INFN Trieste, Gruppo Collegato di Udine, Via delle Scienze 208, I-33100 Udine (Italy); Dalla Betta, G.-F. [DISI, Universita degli Studi di Trento and INFN Padova, Gruppo Collegato d Trento, Via Sommarive 14, I-38123 Trento (Italy); Da Via, C. [School of Physics and Astronomy, University of Manchester, Oxford Road, Manchester M13 9PL (United Kingdom); Darbo, G. [INFN Sezione di Genova, Via Dodecaneso 33, I-14146 Genova (Italy); Gallrapp, C. [CERN, Geneva 23, CH-1211 (Switzerland); Gemme, C. [INFN Sezione di Genova, Via Dodecaneso 33, I-14146 Genova (Italy); Huegging, F.; Janssen, J. [Physikalisches Institut, Universitaet Bonn, Nussallee 12, D-53115 Bonn (Germany); Micelli, A. [Universita degli Studi di Udine and INFN Trieste, Gruppo Collegato di Udine, Via delle Scienze 208, I-33100 Udine (Italy); Pernegger, H. [CERN, Geneva 23, CH-1211 (Switzerland); Povoli, M. [DISI, Universita degli Studi di Trento and INFN Padova, Gruppo Collegato d Trento, Via Sommarive 14, I-38123 Trento (Italy); Wermes, N. [Physikalisches Institut, Universitaet Bonn, Nussallee 12, D-53115 Bonn (Germany); Zorzi, N. [Fondazione Bruno Kessler, FBK-CMM, Via Sommarive 18, I-38123 Trento (Italy)

    2012-07-21

    In this paper we discuss results relevant to 3D Double-Side Double Type Column (3D-DDTC) pixel sensors fabricated at FBK (Trento, Italy) and oriented to the ATLAS upgrade. Some assemblies of these sensors featuring different columnar electrode configurations (2, 3, or 4 columns per pixel) and coupled to the ATLAS FEI3 read-out chip were irradiated up to large proton fluences and tested in laboratory with radioactive sources. In spite of the non-optimized columnar electrode overlap, sensors exhibit reasonably good charge collection properties up to an irradiation fluence of 2 Multiplication-Sign 10{sup 15}n{sub eq}cm{sup -2}, while requiring bias voltages in the order of 100 V. Sensor operation is further investigated by means of TCAD simulations which can effectively explain the basic mechanisms responsible for charge loss after irradiation.

  5. Characterization of proton irradiated 3D-DDTC pixel sensor prototypes fabricated at FBK

    CERN Document Server

    La Rosa, A; Cobal, M; Betta, G -F Dalla; Da Via, C; Darbo, G; Gallrapp, C; Gemme, C; Huegging, F; Janssen, J; Micelli, A; Pernegger, H; Povoli, M; Wermes, N; Zorzi, N

    2012-01-01

    In this paper we discuss results relevant to 3D Double-Side Double Type Column (3D-DDTC) pixel sensors fabricated at FBK (Trento, Italy) and oriented to the ATLAS upgrade. Some assemblies of these sensors featuring different columnar electrode configurations (2, 3, or 4 columns per pixel) and coupled to the ATLAS FEI3 read-out chip were irradiated up to large proton fluences and tested in laboratory with radioactive sources. In spite of the non optimized columnar electrode overlap, sensors exhibit reasonably good charge collection properties up to an irradiation fluence of 2 x 10**15 neq/cm2, while requiring bias voltages in the order of 100 V. Sensor operation is further investigated by means of TCAD simulations which can effectively explain the basic mechanisms responsible for charge loss after irradiation.

  6. Functional characterization of irradiated 3D-DDTC pixel sensor prototypes fabricated at FBK

    CERN Document Server

    La Rosa, A; Cobal, M; Da Viá, C; Betta, G F Dalla; Darbo, G; Gallrapp, C; Gemme, C; Huegging, F; Janssen, J; Micelli, A; Pernegger, H; Povoli, M; Wermes, N; Zorzi, N

    2011-01-01

    In this paper we discuss results relevant to 3D Double-Side Double Type Column (3D-DDTC) pixel sensors fabricated at FBK (Trento, Italy) and oriented to the ATLAS upgrade. Several assemblies of these sensors featuring various columnar electrode configurations (2, 3, or 4 columns per pixel) and coupled to the ATLAS FE-I3 read-out chip were irradiated up to large particle fluences and tested in laboratory with radioactive sources. In spite of the non optimized columnar electrode overlap, sensors exhibit reasonably good charge collection properties up to an irradiation fluence of 2 10**15 neq/cm2 while requiring bias voltages of at most 160V. Sensor operation is further investigated by means of TCAD simulations which can effectively explain the basic mechanisms responsible for charge loss after irradiation.

  7. Wide dynamic range CMOS image sensor with in-pixel double-exposure and synthesis

    Energy Technology Data Exchange (ETDEWEB)

    Li Binqiao; Sun Zhongyan; Xu Jiangtao, E-mail: xujiangtao@tju.edu.c [School of Electronics and Information Engineering, Tianjin University, Tianjin 300072 (China)

    2010-05-15

    A wide-dynamic-range CMOS image sensor (CIS) based on synthesis of a long-time and a short-time exposure signal in the floating diffusion (FD) of a five-transistor active pixel is proposed. With optimized pixel operation, the response curve is compressed and a wide dynamic range image is obtained. A prototype wide-dynamic-range CMOS image sensor was developed with a 0.18 {mu}m CIS process. With the double exposure time 2.4 ms and 70 ns, the dynamic range of the proposed sensor is 80 dB with 30 frames per second (fps). The proposed CMOS image sensor meets the demands of applications in security surveillance systems. (semiconductor integrated circuits)

  8. Design and characterization of novel monolithic pixel sensors for the ALICE ITS upgrade

    CERN Document Server

    Cavicchioli, C; Giubilato, P; Hillemanns, H; Junique, A; Kugathasan, T; Mager, M; Marin Tobon, C A; Martinengo, P; Mattiazzo, S; Mugnier, H; Musa, L; Pantano, D; Rousset, J; Reidt, F; Riedler, P; Snoeys, W; Van Hoorne, J W; Yang, P

    2014-01-01

    Within the R&D activities for the upgrade of the ALICE Inner Tracking System (ITS), Monolithic Active Pixel Sensors (MAPS) are being developed and studied, due to their lower material budget (~0.3%X0~0.3%X0 in total for each inner layer) and higher granularity (View the MathML source~20μm×20μm pixels) with respect to the present pixel detector. This paper presents the design and characterization results of the Explorer0 chip, manufactured in the TowerJazz 180 nm CMOS Imaging Sensor process, based on a wafer with high-resistivity View the MathML source(ρ>1kΩcm) and 18 μm thick epitaxial layer. The chip is organized in two sub-matrices with different pixel pitches (20 μm and 30 μm), each of them containing several pixel designs. The collection electrode size and shape, as well as the distance between the electrode and the surrounding electronics, are varied; the chip also offers the possibility to decouple the charge integration time from the readout time, and to change the sensor bias. The charge c...

  9. Recent Results of the ATLAS Upgrade Planar Pixel Sensors R&D Project

    CERN Document Server

    Weigell, Philipp

    2013-01-01

    To cope with the higher occupancy and radiation damage at the HL-LHC also the LHC experiments will be upgraded. The ATLAS Planar Pixel Sensor R&D Project (PPS) is an international collaboration of 17 institutions and more than 80 scientists, exploring the feasibility of employing planar pixel sensors for this scenario. Depending on the radius, different pixel concepts are investigated using laboratory and beam test measurements. At small radii the extreme radiation environment and strong space constraints are addressed with very thin pixel sensors active thickness in the range of (75-150) mum, and the development of slim as well as active edges. At larger radii the main challenge is the cost reduction to allow for instrumenting the large area of (7-10) m^2. To reach this goal the pixel productions are being transferred to 6 inch production lines. Additionally, investigated are more cost-efficient and industrialised interconnection techniques as well as the n-in-p technology, which, being a single-sided pr...

  10. Novel Silicon n-in-p Pixel Sensors for the future ATLAS Upgrades

    CERN Document Server

    La Rosa, A; Macchiolo, A; Nisius, R; Pernegger, H; Richter,R H; Weigell, P

    2013-01-01

    In view of the LHC upgrade phases towards HL-LHC the ATLAS experiment plans to upgrade the Inner Detector with an all silicon system. The n-in-p silicon technology is a promising candidate for the pixel upgrade thanks to its radiation hardness and cost eectiveness, that allow for enlarging the area instrumented with pixel detectors. We present the characterization and performance of novel n-in-p planar pixel sensors produced by CiS (Germany) connected by bump bonding to the ATLAS readout chip FE-I3. These results are obtained before and after irradiation up to a fluence of 1016 1-MeV $n_{eq}cm^{-2}$, and prove the operability of this kind of sensors in the harsh radiation environment foreseen for the pixel system at HL-LHC. We also present an overview of the new pixel production, which is on-going at CiS for sensors compatible with the new ATLAS readout chip FE-I4.

  11. Novel silicon n-in-p pixel sensors for the future ATLAS upgrades

    Energy Technology Data Exchange (ETDEWEB)

    La Rosa, A., E-mail: alessandro.larosa@cern.ch [Section de Physique (DPNC), Université de Genève, 24 quai Ernest Ansermet, Genève 4, CH-1211 (Switzerland); Gallrapp, C. [CERN, Geneva 23, CH-1211 (Switzerland); Macchiolo, A.; Nisius, R. [Max-Planck-Institut für Physik (Werner-Heisenberg-Institut) Föhringer Ring 6, D-80805 München (Germany); Pernegger, H. [CERN, Geneva 23, CH-1211 (Switzerland); Richter, R.H. [Max-Planck-Institut Halbleiterlabor, Otto Hahn Ring 6, D-81739 München (Germany); Weigell, P. [Max-Planck-Institut für Physik (Werner-Heisenberg-Institut) Föhringer Ring 6, D-80805 München (Germany)

    2013-08-01

    In view of the LHC upgrade phases towards HL-LHC the ATLAS experiment plans to upgrade the inner detector with an all silicon system. The n-in-p silicon technology is a promising candidate for the pixel upgrade thanks to its radiation hardness and cost effectiveness that allow for enlarging the area instrumented with pixel detectors. We present the characterization and performance of novel n-in-p planar pixel sensors produced by CiS (Germany) connected by bump bonding to the ATLAS readout chip FE-I3. These results are obtained before and after irradiation up to a fluence of 10{sup 16}1-MeV n{sub eq}cm{sup −2}, and prove the operability of this kind of sensors in the harsh radiation environment foreseen for the pixel system at HL-LHC. We also present an overview of the new pixel production, which is on-going at CiS for sensors compatible with the new ATLAS readout chip FE-I4.

  12. Pixel area variations in sensors: a novel framework for predicting pixel fidelity and distortion in flat field response

    CERN Document Server

    Rasmussen, Andrew

    2014-01-01

    We describe the drift field in thick depleted silicon sensors as a superposition of a one-dimensional backdrop field and various three-dimensional perturbative contributions that are physically motivated. We compute trajectories for the conversions along the field lines toward the channel and into volumes where conversions are confined by the perturbative fields. We validate this approach by comparing predictions against measured response distributions seen in five types of fixed pattern distortion features. We derive a quantitative connection between "tree ring" flat field distortions to astrometric and shape transfer errors with connections to measurable wavelength dependence - as ancillary pixel data that may be used in pipeline analysis for catalog population. Such corrections may be tested on DECam data, where correlations between tree ring flat field distortions and astrometric errors - together with their band dependence - are already under study. Dynamic effects, including the brighter-fatter phenomen...

  13. Heavily irradiated N-in-p thin planar pixel sensors with and without active edges

    Science.gov (United States)

    Terzo, S.; Andricek, L.; Macchiolo, A.; Moser, H. G.; Nisius, R.; Richter, R. H.; Weigell, P.

    2014-05-01

    We present the results of the characterization of silicon pixel modules employing n-in-p planar sensors with an active thickness of 150 μm, produced at MPP/HLL, and 100-200 μm thin active edge sensor devices, produced at VTT in Finland. These thin sensors are designed as candidates for the ATLAS pixel detector upgrade to be operated at the HL-LHC, as they ensure radiation hardness at high fluences. They are interconnected to the ATLAS FE-I3 and FE-I4 read-out chips. Moreover, the n-in-p technology only requires a single side processing and thereby it is a cost-effective alternative to the n-in-n pixel technology presently employed in the LHC experiments. High precision beam test measurements of the hit efficiency have been performed on these devices both at the CERN SpS and at DESY, Hamburg. We studied the behavior of these sensors at different bias voltages and different beam incident angles up to the maximum one expected for the new Insertable B-Layer of ATLAS and for HL-LHC detectors. Results obtained with 150 μm thin sensors, assembled with the new ATLAS FE-I4 chip and irradiated up to a fluence of 4 × 1015 neq/cm2, show that they are excellent candidates for larger radii of the silicon pixel tracker in the upgrade of the ATLAS detector at HL-LHC. In addition, the active edge technology of the VTT devices maximizes the active area of the sensor and reduces the material budget to suit the requirements for the innermost layers. The edge pixel performance of VTT modules has been investigated at beam test experiments and the analysis after irradiation up to a fluence of 5 × 1015 neq/cm2 has been performed using radioactive sources in the laboratory.

  14. Slim edge studies, design and quality control of planar ATLAS IBL pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Wittig, Tobias

    2013-05-08

    One of the four large experiments at the LHC at CERN is the ATLAS detector, a multi purpose detector. Its pixel detector, composed of three layers, is the innermost part of the tracker. As it is closest to the interaction point, it represents a basic part of the track reconstruction. Besides the requested high resolution one main requirement is the radiation hardness. In the coming years the radiation damage will cause deteriorations of the detector performance. With the planned increase of the luminosity, especially after the upgrade to the High Luminosity LHC, this radiation damage will be even intensified. This circumstance necessitates a new pixel detector featuring improved radiation hard sensors and read-out chips. The present shutdown of the LHC is already utilized to insert an additional b-layer (IBL) into the existing ATLAS pixel detector. The current n-in-n pixel sensor design had to be adapted to the new read-out chip and the module specifications. The new stave geometry requests a reduction of the inactive sensor edge. In a prototype wafer production all modifications have been implemented. The sensor quality control was supervised which led to the decision of the final sensor thickness. In order to evaluate the performance of the sensor chip assemblies with an innovative slim edge design, they have been operated in test beam setups before and after irradiation. Furthermore, the quality control of the planar IBL sensor wafer production was supervised from the stage of wafer delivery to that before the flip chip process to ensure a sufficient amount of functional sensors for the module production.

  15. 1T Pixel Using Floating-Body MOSFET for CMOS Image Sensors

    Directory of Open Access Journals (Sweden)

    Guo-Neng Lu

    2009-01-01

    Full Text Available We present a single-transistor pixel for CMOS image sensors (CIS. It is a floating-body MOSFET structure, which is used as photo-sensing device and source-follower transistor, and can be controlled to store and evacuate charges. Our investigation into this 1T pixel structure includes modeling to obtain analytical description of conversion gain. Model validation has been done by comparing theoretical predictions and experimental results. On the other hand, the 1T pixel structure has been implemented in different configurations, including rectangular-gate and ring-gate designs, and variations of oxidation parameters for the fabrication process. The pixel characteristics are presented and discussed.

  16. A rad-hard CMOS active pixel sensor for electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Battaglia, Marco [Department of Physics, University of California at Berkeley, CA 94720 (United States); Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)], E-mail: MBattaglia@lbl.gov; Contarato, Devis; Denes, Peter; Doering, Dionisio [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Giubilato, Piero [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); INFN, Sezione di Padova, I-35131 (Italy); Dipartimento di Fisica, Universita degli Studi, Padova I-35131 (Italy); Kim, Tae Sung [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Mattiazzo, Serena [INFN, Sezione di Padova, I-35131 (Italy); Dipartimento di Fisica, Universita degli Studi, Padova I-35131 (Italy); Radmilovic, Velimir [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Zalusky, Sarah [Department of Physics, University of California at Berkeley, CA 94720 (United States); Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

    2009-01-11

    Monolithic CMOS pixel sensors offer unprecedented opportunities for fast nano-imaging through direct electron detection in transmission electron microscopy. We present the design and a full characterisation of a CMOS pixel test structure able to withstand doses in excess of 1 Mrad. Data collected with electron beams at various energies of interest in electron microscopy are compared to predictions of simulation and to 1.5 GeV electron data to disentagle the effect of multiple scattering. The point spread function measured with 300 keV electrons is (8.1{+-}1.6){mu}m for 10{mu}m pixel and (10.9{+-}2.3){mu}m for 20{mu}m pixels, respectively, which agrees well with the values of 8.4 and 10.5{mu}m predicted by our simulation.

  17. A 30 frames-per-second 18-million pixel image sensor for space applications

    Science.gov (United States)

    Lee, Paul P. K.; Newman, J. Daniel; Sacco, Andrew P.

    2011-06-01

    ITT Geospatial Systems has space-qualified a visible band interline Charge Coupled Device (CCD) image sensor with 18 million pixels developed using commercial technology. The sensor is comprised of an 4320 (H) x 4144 (V) array of 8 micron square pixels. With multiple analog outputs each operating at 20 MHz the sensor will support 30 frames per second continuous video capture. The pixel incorporates a pinned photodiode, vertical overflow drain and microlens to achieve low dark current, lag-free imaging with highspeed global electronic shutter at high quantum efficiency (QE). The vertical and horizontal CCD's are true two-phase designs which support an integrate-while-read operation. The sensor chip is mounted on an Aluminum Nitride co-fired ceramic package optimized for electrical signal integrity, thermal and optical stability. The architecture supports quadrant redundancy. The complete assembly has been space-qualified to a Technology Readiness Level (TRL) of 6 with Total Ionization Dose (TID) radiation testing at 25 Krad. The sensor exceeds 12-bit of dynamic range and 31% QE with 5 W of total power. The nonlinearity is measured to be 1.0% while the global non-uniformity is less than 2%. The low defect density of the CCD sensor allows high resolution video imaging in a space environment.

  18. A three-phase time-correlation image sensor using pinned photodiode active pixels

    Science.gov (United States)

    Han, Sangman; Iwahori, Tomohiro; Sawada, Tomonari; Kawahito, Shoji; Ando, Shigeru

    2010-01-01

    A time correlation (TC) image sensor is a device that produces 3-phase time-correlated signals between the incident light intensity and three reference signals. A conventional implementation of the TC image sensor using a standard CMOS technology works at low frequency and with low sensitivity. In order to achieve higher modulation frequency and high sensitivity, the TC image sensor with a dual potential structure using a pinned diode is proposed. The dual potential structure is created by changing the impurity doping concentration in the two different potential regions. In this structure, high-frequency modulation can be achieved, while maintaining a sufficient light receiving area. A prototype TC image sensor with 366×390pixels is implemented with 0.18-μm 1P4M CMOS image sensor technology. Each pixel with the size of 12μm×12μm has one pinned photodiode with the dual potential structure, 12 transistors and 3capacitors to implement three-parallel-output active pixel circuits. A fundamental operation of the implemented TC sensor is demonstrated.

  19. First prototypes of two-tier avalanche pixel sensors for particle detection

    Science.gov (United States)

    Pancheri, L.; Brogi, P.; Collazuol, G.; Dalla Betta, G.-F.; Ficorella, A.; Marrocchesi, P. S.; Morsani, F.; Ratti, L.; Savoy-Navarro, A.

    2017-02-01

    In this paper, we present the implementation and preliminary evaluation of a new type of silicon sensor for charged particle detection operated in Geiger-mode. The proposed device, formed by two vertically-aligned pixel arrays, exploits the coincidence between two simultaneous avalanche events to discriminate between particle-triggered detections and dark counts. A proof-of-concept two-layer sensor with per-pixel coincidence circuits was designed and fabricated in a 150 nm CMOS process and vertically integrated through bump bonding. The sensor includes a 48×16 pixel array with 50 μ m × 75 μ m pixels. This work describes the sensor architecture and reports a selection of results from the characterization of the avalanche detectors in the two layers. Detectors with an active area of 43 × 45 μ m2 have a median dark count rate of 3 kHz at 3.3 V excess bias and a breakdown voltage non-uniformity lower than 20 mV.

  20. Results with p-type pixel sensors with different geometries for the HL-LHC

    Energy Technology Data Exchange (ETDEWEB)

    Allport, P.P. [Department of Physics, University of Liverpool, Oxford Road, Liverpool, L69 7ZE (United Kingdom); Bates, R.; Butter, C. [Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ (United Kingdom); Casse, G. [Department of Physics, University of Liverpool, Oxford Road, Liverpool, L69 7ZE (United Kingdom); Dervan, P.J., E-mail: Paul.Dervan@cern.ch [Department of Physics, University of Liverpool, Oxford Road, Liverpool, L69 7ZE (United Kingdom); Forshaw, D.; Tsurin, I. [Department of Physics, University of Liverpool, Oxford Road, Liverpool, L69 7ZE (United Kingdom)

    2013-12-11

    Pixel detectors will be extensively used for the four innermost layers of the upgraded ATLAS experiment at the future High Luminosity LHC (HL-LHC) at CERN. The total area of pixel sensors will be over 5 m{sup 2}. The silicon sensors that will instrument the pixel volume will have to face several technology challenges. They will have to withstand doses up to 2×10{sup 16} n{sub eq}cm{sup −2}, to have a reduced inactive area at the edge of the sensors still being able to hold 1000 V bias voltage and to be relatively low cost considering the large area to be covered. N-side readout on p-type bulk is the most promising technology for satisfying the various requirements. Several sensor types have been produced in the UK, conceived for various readout systems, for studying the properties of n-in-p and n-in-n sensors before and after irradiation with test beam and laboratory measurements. The status of these studies is presented here.

  1. Experiment on digital CDS with 33-M pixel 120-fps super hi-vision image sensor

    Science.gov (United States)

    Yonai, J.; Yasue, T.; Kitamura, K.; Hayashida, T.; Watabe, T.; Shimamoto, H.; Kawahito, S.

    2014-03-01

    We have developed a CMOS image sensor with 33 million pixels and 120 frames per second (fps) for Super Hi-Vision (SHV:8K version of UHDTV). There is a way to reduce the fixed pattern noise (FPN) caused in CMOS image sensors by using digital correlated double sampling (digital CDS), but digital CDS methods need high-speed analog-to-digital conversion and are not applicable to conventional UHDTV image sensors due to their speed limit. Our image sensor, on the other hand, has a very fast analog-to-digital converter (ADC) using "two-stage cyclic ADC" architecture that is capable of being driven at 120-fps, which is double the normal frame rate for TV. In this experiment, we performed experimental digital CDS using the high-frame rate UHDTV image sensor. By reading the same row twice at 120-fps and subtracting dark pixel signals from accumulated pixel signals, we obtained a 60-fps equivalent video signal with digital noise reduction. The results showed that the VFPN was effectively reduced from 24.25 e-rms to 0.43 e-rms.

  2. Optical confinement methods for continued scaling of CMOS image sensor pixels.

    Science.gov (United States)

    Fesenmaier, Christian C; Huo, Yijie; Catrysse, Peter B

    2008-12-08

    The pixels that make up CMOS image sensors have steadily decreased in size over the last decade. This scaling has two effects: first, the amount of light incident on each pixel decreases, making optical efficiency, i.e., the collection of each photon, more important. Second, diffraction comes into play when pixel size approaches the wavelength of visible light, resulting in increased spatial optical crosstalk. To address these two effects, we investigate and compare three methods for guiding incident light from the microlens down to the photodiode. Two of these techniques rely on total internal reflection (TIR) at the boundary between dielectric media of different refractive indices, while the third uses reflection at a metal-dielectric interface to confine the light. Simulations are performed using a finite-difference time-domain (FDTD) method on a realistic 1.75-mum pixel model for on-axis as well as angled incidence. We evaluate the optical efficiency and spatial crosstalk performance of these methods compared to a reference pixel and find significant (10%) improvement for the TIR designs with properly chosen parameters and nearly full spatial crosstalk elimination using metal to confine the light. We also show that these improvements are comparable to those achieved by thinning the image sensor stack.

  3. Performance of novel silicon n-in-p planar Pixel Sensors

    CERN Document Server

    Gallrapp, C; Macchiolo, A; Nisius, R; Pernegger, H; Richter, R H; Weigell, P

    2012-01-01

    The performance of novel n-in-p planar pixel detectors, designed for future upgrades of the ATLAS Pixel system is presented. The n-in-p silicon sensors technology is a promising candidate for the pixel upgrade thanks to its radiation hardness and cost effectiveness, that allow for enlarging the area instrumented with pixel detectors. The n-in-p modules presented here, are composed of pixel sensors produced by CiS connected by bump-bonding to the ATLAS readout chip FE-I3. The characterization of these devices has been performed before and after irradiation up to a fluence of 5 x 10**15 neq/cm2 . Charge collection measurements carried out with radioactive sources have proven the functioning of this technology up to these particle fluences. First results from beam test data with a 120 GeV/c pion beam at the CERN-SPS are also discussed, demonstrating a high tracking efficiency before irradiation, and a high collected charge for a device irradiated at a fluence of 5 x 10**15 neq/cm2 .

  4. Pixel sensors with different pitch layouts for ATLAS Phase-II upgrade

    CERN Document Server

    Dervan, Paul

    2014-01-01

    Different pitch layouts are considered for the pixel detector being designed for the ATLAS up- graded tracking system which will be operating at the High Luminosity LHC. The tracking per- formance in the Endcap pixel regions could benefit from pixel layouts which differ from the ge- ometries used in the barrel region. Also, the performance in different barrel layers and eta regions could be optimised using different pixel sizes. This presentation will report on the development and tests of pitch layouts which could be readout by the FE-I4 ASICs. The pixel geometries in- clude 50 250 m m 2 , 25 500 m m 2 , 100 125 m m 2 , 125 167 m m 2 , 50 2000 m m 2 and 25 2000 m m 2 . The sensors with geometries 50 250 m m 2 , 25 500 m m 2 and 100 125 m m 2 were irradiated and tested at the DESY testbeam. These and other testbeam results as well as results from characterisation of these sensors in the laboratory will be presented

  5. Compact SPAD-Based Pixel Architectures for Time-Resolved Image Sensors.

    Science.gov (United States)

    Perenzoni, Matteo; Pancheri, Lucio; Stoppa, David

    2016-05-23

    This paper reviews the state of the art of single-photon avalanche diode (SPAD) image sensors for time-resolved imaging. The focus of the paper is on pixel architectures featuring small pixel size (20%) as a key enabling technology for the successful implementation of high spatial resolution SPAD-based image sensors. A summary of the main CMOS SPAD implementations, their characteristics and integration challenges, is provided from the perspective of targeting large pixel arrays, where one of the key drivers is the spatial uniformity. The main analog techniques aimed at time-gated photon counting and photon timestamping suitable for compact and low-power pixels are critically discussed. The main features of these solutions are the adoption of analog counting techniques and time-to-analog conversion, in NMOS-only pixels. Reliable quantum-limited single-photon counting, self-referenced analog-to-digital conversion, time gating down to 0.75 ns and timestamping with 368 ps jitter are achieved.

  6. Compact SPAD-Based Pixel Architectures for Time-Resolved Image Sensors

    Directory of Open Access Journals (Sweden)

    Matteo Perenzoni

    2016-05-01

    Full Text Available This paper reviews the state of the art of single-photon avalanche diode (SPAD image sensors for time-resolved imaging. The focus of the paper is on pixel architectures featuring small pixel size (<25 μm and high fill factor (>20% as a key enabling technology for the successful implementation of high spatial resolution SPAD-based image sensors. A summary of the main CMOS SPAD implementations, their characteristics and integration challenges, is provided from the perspective of targeting large pixel arrays, where one of the key drivers is the spatial uniformity. The main analog techniques aimed at time-gated photon counting and photon timestamping suitable for compact and low-power pixels are critically discussed. The main features of these solutions are the adoption of analog counting techniques and time-to-analog conversion, in NMOS-only pixels. Reliable quantum-limited single-photon counting, self-referenced analog-to-digital conversion, time gating down to 0.75 ns and timestamping with 368 ps jitter are achieved.

  7. Development of CMOS Active Pixel Image Sensors for Low Cost Commercial Applications

    Science.gov (United States)

    Fossum, E.; Gee, R.; Kemeny, S.; Kim, Q.; Mendis, S.; Nakamura, J.; Nixon, R.; Ortiz, M.; Pain, B.; Zhou, Z.; Ackland, B.; Dickinson, A.; Eid, E.; Inglis, D.

    1994-01-01

    This paper describes ongoing research and development of CMOS active pixel image sensors for low cost commercial applications. A number of sensor designs have been fabricated and tested in both p-well and n-well technologies. Major elements in the development of the sensor include on-chip analog signal processing circuits for the reduction of fixed pattern noise, on-chip timing and control circuits and on-chip analog-to-digital conversion (ADC). Recent results and continuing efforts in these areas will be presented.

  8. 3D-FBK pixel sensors with CMS readout: First test results

    Energy Technology Data Exchange (ETDEWEB)

    Obertino, M., E-mail: margherita.obertino@cern.ch [Università del Piemonte Orientale, Novara, and INFN, Torino (Italy); Solano, A. [Università di Torino and INFN, Torino (Italy); Vilela Pereira, A. [INFN, Torino (Italy); Alagoz, E. [Physics Department, Purdue University, West Lafayette, IN (United States); Andresen, J. [Colorado University, Colorado (United States); Arndt, K.; Bolla, G.; Bortoletto, D. [Physics Department, Purdue University, West Lafayette, IN (United States); Boscardin, M. [Centro per i Materiali e i Microsistemi Fondazione Bruno Kessler (FBK), Povo di Trento (Italy); Brosius, R. [SUNY, Buffalo (United States); Bubna, M. [Physics Department, Purdue University, West Lafayette, IN (United States); Dalla Betta, G.-F. [INFN Padova (Gruppo Collegato di Trento) and Università di Trento, Povo di Trento (Italy); Jensen, F. [Colorado University, Colorado (United States); Krzywda, A. [Physics Department, Purdue University, West Lafayette, IN (United States); Kumar, A. [SUNY, Buffalo (United States); Kwan, S. [Università di Milano Bicocca and INFN, Milano (Italy); Lei, C.M. [Colorado University, Colorado (United States); Menasce, D.; Moroni, L. [INFN Milano Bicocca, Milano (Italy); Ngadiuba, J. [Università di Milano Bicocca and INFN, Milano (Italy); and others

    2013-08-01

    Silicon 3D detectors consist of an array of columnar electrodes of both doping types which penetrate entirely in the detector bulk, perpendicularly to the surface. They are emerging as one of the most promising technologies for innermost layers of tracking devices for the foreseen upgrades of the LHC. Until recently, properties of 3D sensors have been investigated mostly with ATLAS readout electronics. 3D pixel sensors compatible with the CMS readout were first fabricated at SINTEF (Oslo, Norway), and more recently at FBK (Trento, Italy) and CNM (Barcelona, Spain). Several sensors with different electrode configurations, bump-bonded with the CMS pixel PSI46 readout chip, were characterized in laboratory and tested at Fermilab with a proton beam of 120 GeV/c. Preliminary results of the data analysis are presented.

  9. Thin n-in-p planar pixel sensors and active edge sensors for the ATLAS upgrade at HL-LHC

    Science.gov (United States)

    Terzo, S.; Macchiolo, A.; Nisius, R.; Paschen, B.

    2014-12-01

    Silicon pixel modules employing n-in-p planar sensors with an active thickness of 200 μm, produced at CiS, and 100-200 μm thin active/slim edge sensor devices, produced at VTT in Finland have been interconnected to ATLAS FE-I3 and FE-I4 read-out chips. The thin sensors are designed for high energy physics collider experiments to ensure radiation hardness at high fluences. Moreover, the active edge technology of the VTT production maximizes the sensitive region of the assembly, allowing for a reduced overlap of the modules in the pixel layer close to the beam pipe. The CiS production includes also four chip sensors according to the module geometry planned for the outer layers of the upgraded ATLAS pixel detector to be operated at the HL-LHC. The modules have been characterized using radioactive sources in the laboratory and with high precision measurements at beam tests to investigate the hit efficiency and charge collection properties at different bias voltages and particle incidence angles. The performance of the different sensor thicknesses and edge designs are compared before and after irradiation up to a fluence of 1.4 × 1016 neq/cm2.

  10. Imaging properties of small-pixel spectroscopic x-ray detectors based on cadmium telluride sensors.

    Science.gov (United States)

    Koenig, Thomas; Schulze, Julia; Zuber, Marcus; Rink, Kristian; Butzer, Jochen; Hamann, Elias; Cecilia, Angelica; Zwerger, Andreas; Fauler, Alex; Fiederle, Michael; Oelfke, Uwe

    2012-11-07

    Spectroscopic x-ray imaging by means of photon counting detectors has received growing interest during the past years. Critical to the image quality of such devices is their pixel pitch and the sensor material employed. This paper describes the imaging properties of Medipix2 MXR multi-chip assemblies bump bonded to 1 mm thick CdTe sensors. Two systems were investigated with pixel pitches of 110 and 165 μm, which are in the order of the mean free path lengths of the characteristic x-rays produced in their sensors. Peak widths were found to be almost constant across the energy range of 10 to 60 keV, with values of 2.3 and 2.2 keV (FWHM) for the two pixel pitches. The average number of pixels responding to a single incoming photon are about 1.85 and 1.45 at 60 keV, amounting to detective quantum efficiencies of 0.77 and 0.84 at a spatial frequency of zero. Energy selective CT acquisitions are presented, and the two pixel pitches' abilities to discriminate between iodine and gadolinium contrast agents are examined. It is shown that the choice of the pixel pitch translates into a minimum contrast agent concentration for which material discrimination is still possible. We finally investigate saturation effects at high x-ray fluxes and conclude with the finding that higher maximum count rates come at the cost of a reduced energy resolution.

  11. Recent results of the ATLAS upgrade Planar Pixel Sensors R&D project

    Science.gov (United States)

    Forshaw, Dean

    2013-12-01

    To extend the physics reach of the LHC, upgrades to the accelerator are planned which will increase the integrated annual luminosity by a factor of 5-10. This will increase the occupancy and the radiation damage of the inner trackers. To cope with the elevated occupancy, the ATLAS experiment plans to introduce an all silicon inner tracker for High Luminosity LHC (HL-LHC) operation. With silicon, the occupancy can be adjusted by using the appropriate pitch for the pixels/micro-strips. Constraints due to high radiation damage mean that only sensors with electrode configuration designed to read out the electron signal (n-in-p and n-in-n) are considered. To investigate the suitability of planar pixel sensors (PPS) for the ATLAS tracker upgrade, a dedicated R&D project was established, with 17 institutes and more than 80 scientists. The main focuses of research are the performance of planar pixel sensors after the high fluences expected during HL-LHC operation, the optimisation of the detector and module production technologies for cost reduction to enable the instrumentation of large volumes and the reduction of the inactive areas needed for electrical insulation of the sensitive region from the cut edge of the sensors. An overview of recent accomplishments of the PPS (Planar Pixel Sensors) R&D project is given. The performance in terms of charge collection and tracking efficiency, evaluated with radioactive sources in the laboratory and from beam tests, is presented. Sensors with different thicknesses (ranging from 75 to 300 μm) were irradiated to several fluences up to 2 ×1016neqcm-2 to study the effect of varying thickness on the radiation hardness. The significant progresses made towards the reduction of the edge distance are reported.

  12. Radiation resistance of double-type double-sided 3D pixel sensors

    CERN Document Server

    Fernandez, M; Lozano, M; Munoz, F.J; Pellegrini, G; Quirion, D; Rohe, T; Vila, I

    2013-01-01

    The proposed high-luminosity upgrade of the Large Hadron Collider is expected to increase the instantaneous luminosity at the experiments' interaction points by a factor of ten. The vertex detector will be the subsystem most affected by the luminosity increase, raising substantially their occupancy and radiation-induced damage. To preserve the vertex physics performance under these new conditions, current pixel technologies have to be improved. Hybrid pixel sensors with double-sided double-type vertical electrodes (3D sensors) are becoming a mature technology for the detector layers closest to the interaction point due to their intrinsic radiation hardness. In addition, the double-sided implementation of the 3D pixel technology provides some additional technical advantages with respect to the single-sided implementation. For this study, 3D pixel sensors manufactured at the Centro Nacional de Microelectrónica of Barcelona (IMB-CNM) have been bonded to the PSI46 readout chip currently used by the Compact Muon ...

  13. Radiation resistance of double-type double-sided 3D pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Fernandez, M.; Jaramillo, R. [Instituto de Física de Cantabria IFCA (CSIC-UC), Avd. de los Castros s/n, 39005 Santander (Spain); Lozano, M. [Centro Nacional de Microelectrónica de Barcelona IMB-CNM (CSIC), Campus Univ. Autónoma de Barcelona, 08193 Bellaterra (Spain); Munoz, F.J., E-mail: fjmunoz@ifca.unican.es [Instituto de Física de Cantabria IFCA (CSIC-UC), Avd. de los Castros s/n, 39005 Santander (Spain); Pellegrini, G.; Quirion, D. [Centro Nacional de Microelectrónica de Barcelona IMB-CNM (CSIC), Campus Univ. Autónoma de Barcelona, 08193 Bellaterra (Spain); Rohe, T. [Paul Sherrer Institute PSI, 5232 Villigen (Switzerland); Vila, I. [Instituto de Física de Cantabria IFCA (CSIC-UC), Avd. de los Castros s/n, 39005 Santander (Spain)

    2013-12-21

    The proposed high-luminosity upgrade of the Large Hadron Collider is expected to increase the instantaneous luminosity at the experiments' interaction points by a factor of ten. The vertex detector will be the subsystem most affected by the luminosity increase, raising substantially their occupancy and radiation-induced damage. To preserve the vertex physics performance under these new conditions, current pixel technologies have to be improved. Hybrid pixel sensors with double-sided double-type vertical electrodes (3D sensors) are becoming a mature technology for the detector layers closest to the interaction point due to their intrinsic radiation hardness. In addition, the double-sided implementation of the 3D pixel technology provides some additional technical advantages with respect to the single-sided implementation. For this study, 3D pixel sensors manufactured at the Centro Nacional de Microelectrónica of Barcelona (IMB-CNM) have been bonded to the PSI46 readout chip currently used by the Compact Muon Solenoid vertex detector. Detector performance before and after irradiation up to fluences of 5×10{sup 15}n{sub eq}/cm{sup 2} is presented.

  14. Testbeam results of irradiated ams H18 HV-CMOS pixel sensor prototypes

    CERN Document Server

    INSPIRE-00211411; Braccini, S.; Casse, G.; Chen, H.; Chen, K.; Di Bello, F.A.; Ferrere, D.; Golling, T.; Gonzalez-Sevilla, S.; Iacobucci, G.; Kiehn, M.; Lanni, F.; Liu, H.; Meng, L.; Merlassino, C.; Miucci, A.; Muenstermann, D.; Nessi, M.; Okawa, H.; Peric, I.; Rimoldi, M.; Ristic, B.; Vicente Barrero Pinto, M.; Vossebeld, J.; Weber, M.; Weston, T.; Wu, W.; Xu, L.; Zaffaroni, E.

    2016-01-01

    HV-CMOS pixel sensors are a promising option for the tracker upgrade of the ATLAS experiment at the LHC, as well as for other future tracking applications in which large areas are to be instrumented with radiation-tolerant silicon pixel sensors. We present results of testbeam characterisations of the $4^{\\mathrm{th}}$ generation of Capacitively Coupled Pixel Detectors (CCPDv4) produced with the ams H18 HV-CMOS process that have been irradiated with different particles (reactor neutrons and 18 MeV protons) to fluences between $1\\cdot 10^{14}$ and $5\\cdot 10^{15}$ 1-MeV-n$_\\textrm{eq}$/cm$^2$. The sensors were glued to ATLAS FE-I4 pixel readout chips and measured at the CERN SPS H8 beamline using the FE-I4 beam telescope. Results for all fluences are very encouraging with all hit efficiencies being better than 97% for bias voltages of $85\\,$V. The sample irradiated to a fluence of $1\\cdot 10^{15}$ n$_\\textrm{eq}$/cm$^2$ - a relevant value for a large volume of the upgraded tracker - exhibited 99.7% average hit ...

  15. CMOS pixel sensors on high resistive substrate for high-rate, high-radiation environments

    Science.gov (United States)

    Hirono, Toko; Barbero, Marlon; Breugnon, Patrick; Godiot, Stephanie; Gonella, Laura; Hemperek, Tomasz; Hügging, Fabian; Krüger, Hans; Liu, Jian; Pangaud, Patrick; Peric, Ivan; Pohl, David-Leon; Rozanov, Alexandre; Rymaszewski, Piotr; Wang, Anqing; Wermes, Norbert

    2016-09-01

    A depleted CMOS active pixel sensor (DMAPS) has been developed on a substrate with high resistivity in a high voltage process. High radiation tolerance and high time resolution can be expected because of the charge collection by drift. A prototype of DMAPS was fabricated in a 150 nm process by LFoundry. Two variants of the pixel layout were tested, and the measured depletion depths of the variants are 166 μm and 80 μm. We report the results obtained with the prototype fabricated in this technology.

  16. CMOS pixel sensors on high resistive substrate for high-rate, high-radiation environments

    Energy Technology Data Exchange (ETDEWEB)

    Hirono, Toko, E-mail: thirono@uni-bonn.de [Physikalisches Institute der Universität Bonn, Bonn (Germany); Barbero, Marlon; Breugnon, Patrick; Godiot, Stephanie [CPPM, Aix-Marseille Universite, CNRS/IN2P3, Marseille (France); Gonella, Laura; Hemperek, Tomasz; Hügging, Fabian; Krüger, Hans [Physikalisches Institute der Universität Bonn, Bonn (Germany); Liu, Jian; Pangaud, Patrick [CPPM, Aix-Marseille Universite, CNRS/IN2P3, Marseille (France); Peric, Ivan [IPE, Karlsruher Institut für Technologie, Karlsruhe (Germany); Pohl, David-Leon [Physikalisches Institute der Universität Bonn, Bonn (Germany); Rozanov, Alexandre [CPPM, Aix-Marseille Universite, CNRS/IN2P3, Marseille (France); Rymaszewski, Piotr [Physikalisches Institute der Universität Bonn, Bonn (Germany); Wang, Anqing [CPPM, Aix-Marseille Universite, CNRS/IN2P3, Marseille (France); Wermes, Norbert [Physikalisches Institute der Universität Bonn, Bonn (Germany)

    2016-09-21

    A depleted CMOS active pixel sensor (DMAPS) has been developed on a substrate with high resistivity in a high voltage process. High radiation tolerance and high time resolution can be expected because of the charge collection by drift. A prototype of DMAPS was fabricated in a 150 nm process by LFoundry. Two variants of the pixel layout were tested, and the measured depletion depths of the variants are 166 μm and 80 μm. We report the results obtained with the prototype fabricated in this technology.

  17. Radiation Damage Modeling for 3D Pixel Sensors in the ATLAS Detector

    CERN Document Server

    Wallangen, Veronica; The ATLAS collaboration

    2017-01-01

    Silicon Pixel detectors are at the core of the current and planned upgrade of the ATLAS detector. As the detector in closest proximity to the interaction point, these detectors will be subjected to a significant amount of radiation over their lifetime: prior to the HL-LHC, the innermost layers will receive a fluence in excess of 10^15 neq/cm2 and the HL-LHC detector upgrades must cope with an order of magnitude higher fluence integrated over their lifetimes. This poster presents the details of a new digitization model that includes radiation damage effects to the 3D Pixel sensors for the ATLAS Detector.

  18. CMOS pixel sensor response to low energy electrons in transmission electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Battaglia, Marco [Department of Physics, University of California at Berkeley, CA 94720 (United States); Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)], E-mail: MBattaglia@lbl.gov; Contarato, Devis; Denes, Peter; Doering, Dionisio; Radmilovic, Velimir [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

    2009-07-01

    This letter presents the results of a study of the response of a test CMOS sensor with a radiation tolerant pixel cell design to 80 and 100 keV electrons. The point spread function is measured to be (13.0{+-}1.7){mu}m at 100 keV and (12.1{+-}1.6){mu}m at 80 keV, for 20{mu}m pixels. Results agree well with values predicted by a Geant-4 and dedicated charge collection simulation.

  19. A new pixel level digital read out integrated circuits for ultraviolet imaging sensors

    Science.gov (United States)

    Xu, Bin; Lan, Tian-yi; Yuan, Yong-gang; Li, Xiang-yang

    2014-11-01

    The ultraviolet imaging sensors consist of two important parts: the array of detectors and the read out integrated circuits. Along with the demand for the fine resolution, large input dynamic range and high integration degree of the imaging sensors, the functions of read out integrated circuits are becoming more and more important. The on chip analog to digital conversion is the main directions of research on this area. In this paper, we presented a new digital read out integrated circuits for ultraviolet imaging sensors. The proposed circuits have an analog to digital converter in each pixel, which enable the parallel analog to digital conversion of the whole pixel array. The developed circuits have a 50um×50um pixel area with a 128×128 size, and are designed in a 0.35um four metal double poly mixed signal CMOS process. The simulation results show that the designed analog to digital converter has an accuracy of 0.2mV and can achieve the dynamic range of 88dB. The proposed circuits realize the low noise and high speed digital output of read out integrated circuits for ultraviolet imaging sensors.

  20. Non-equal spacing CMOS sensor impact on response between even and odd pixels

    Science.gov (United States)

    Liu, Cynthia; Chen, Nai-Yu

    2010-10-01

    With the self-developing CMOS imaging sensors in the instrument Focal Plane Assembly (FPA), there is flexibility in the trade-off for optimal specifications of CMOS sensor for systematic study. The criteria considered for the optimization are MTF and SNR, the CMOS imaging sensor considered is with TDI (time delay integration) feature. Among the specifications, fill factor is a key item. It affect not only the window effect in FPA MTF (static), but also the smearing effect in dynamic MTF, especially in satellite along track direction. Considering different fill factors, mirror-type and non-mirror-type pixel layout were studied for estimating the system MTF, another concern from image user point of view is mirror type pixel layout may cause different response between even and odd pixels. This work is to present the analysis results based on the construction of the non-equal spacing signal via Whittaker -Shannon interpolation formula. Further to present the analysis results about fill factor and stage number of TDI CMOS sensor. The result can function as a practice of FPA design specification.

  1. Heavily Irradiated N-in-p Thin Planar Pixel Sensors with and without Active Edges

    CERN Document Server

    Terzo, S; Macchiolo, A; Moser, H G; Nisius, R; Richter, R H; Weigell, P

    2014-01-01

    We present the results of the characterization of silicon pixel modules employing n-in-p planar sensors with an active thickness of 150 $\\mathrm{\\mu}$m, produced at MPP/HLL, and 100-200 $\\mathrm{\\mu}$m thin active edge sensor devices, produced at VTT in Finland. These thin sensors are designed as candidates for the ATLAS pixel detector upgrade to be operated at the HL-LHC, as they ensure radiation hardness at high fluences. They are interconnected to the ATLAS FE-I3 and FE-I4 read-out chips. Moreover, the n-in-p technology only requires a single side processing and thereby it is a cost-effective alternative to the n-in-n pixel technology presently employed in the LHC experiments. High precision beam test measurements of the hit efficiency have been performed on these devices both at the CERN SpS and at DESY, Hamburg. We studied the behavior of these sensors at different bias voltages and different beam incident angles up to the maximum one expected for the new Insertable B-Layer of ATLAS and for HL-LHC detect...

  2. 3D-FBK Pixel sensors: recent beam tests results with irradiated devices

    CERN Document Server

    Micelli, A; Sandaker, H; Stugu, B; Barbero, M; Hugging, F; Karagounis, M; Kostyukhin, V; Kruger, H; Tsung, J W; Wermes, N; Capua, M; Fazio, S; Mastroberardino, A; Susinno, G; Gallrapp, C; Di Girolamo, B; Dobos, D; La Rosa, A; Pernegger, H; Roe, S; Slavicek, T; Pospisil, S; Jakobs, K; Kohler, M; Parzefall, U; Darbo, G; Gariano, G; Gemme, C; Rovani, A; Ruscino, E; Butter, C; Bates, R; Oshea, V; Parker, S; Cavalli-Sforza, M; Grinstein, S; Korokolov, I; Pradilla, C; Einsweiler, K; Garcia-Sciveres, M; Borri, M; Da Via, C; Freestone, J; Kolya, S; Lai, C H; Nellist, C; Pater, J; Thompson, R; Watts, S J; Hoeferkamp, M; Seidel, S; Bolle, E; Gjersdal, H; Sjobaek, K N; Stapnes, S; Rohne, O; Su, D; Young, C; Hansson, P; Grenier, P; Hasi, J; Kenney, C; Kocian, M; Jackson, P; Silverstein, D; Davetak, H; DeWilde, B; Tsybychev, D; Dalla Betta, G F; Gabos, P; Povoli, M; Cobal, M; Giordani, M P; Selmi, L; Cristofoli, A; Esseni, D; Palestri, P; Fleta, C; Lozano, M; Pellegrini, G; Boscardin, M; Bagolini, A; Piemonte, C; Ronchin, S; Zorzi, N; Hansen, T E; Hansen, T; Kok, A; Lietaer, N; Kalliopuska, J; Oja, A

    2011-01-01

    The Pixel detector is the innermost part of the ATLAS experiment tracking device at the Large Hadron Collider (LHC), and plays a key role in the reconstruction of the primary and secondary vertices of short-lived particles. To cope with the high level of radiation produced during the collider operation, it is planned to add to the present three layers of silicon pixel sensors which constitute the Pixel Detector, an additional layer (Insertable B-Layer, or IBL) of sensors. 3D silicon sensors are one of the technologies which are under study for the IBL. 3D silicon technology is an innovative combination of very-large-scale integration (VLSI) and Micro-Electro-Mechanical-Systems (MEMS) where electrodes are fabricated inside the silicon bulk instead of being implanted on the wafer surfaces. 3D sensors, with electrodes fully or partially penetrating the silicon substrate, are currently fabricated at different processing facilities in Europe and USA. This paper reports on the 2010 June beam test results for irradi...

  3. Thin n-in-p planar pixel sensors and active edge sensors for the ATLAS upgrade at HL-LHC

    CERN Document Server

    Terzo, Stefano; Nisius, R.; Paschen, B.

    2014-01-01

    Silicon pixel modules employing n-in-p planar sensors with an active thickness of 200 $\\mu$m, produced at CiS, and 100-200 $\\mu$m thin active/slim edge sensor devices, produced at VTT in Finland have been interconnected to ATLAS FE-I3 and FE-I4 read-out chips. The thin sensors are designed for high energy physics collider experiments to ensure radiation hardness at high fluences. Moreover, the active edge technology of the VTT production maximizes the sensitive region of the assembly, allowing for a reduced overlap of the modules in the pixel layer close to the beam pipe. The CiS production includes also four chip sensors according to the module geometry planned for the outer layers of the upgraded ATLAS pixel detector to be operated at the HL-LHC. The modules have been characterized using radioactive sources in the laboratory and with high precision measurements at beam tests to investigate the hit efficiency and charge collection properties at different bias voltages and particle incidence angles. The perfo...

  4. Overview of Silicon Pixel Sensor Development for the ATLAS Insertable B-Layer (IBL)

    CERN Document Server

    Grinstein, S; The ATLAS collaboration

    2011-01-01

    The ATLAS Pixel Detector is the innermost part of the ATLAS tracking system and is critical for track and vertex reconstruction. In order to preserve the tracking performance notwithstanding the increasing instantaneous luminosity delivered by the LHC, ATLAS plans to introduce a new pixel layer (IBL) mounted directly on a reduced diameter beam pipe. The IBL will have to sustain an estimated radiation dose, including safety factors, of $5 imes 10^{15}$~n$_{eq}$/cm$^2$. Two sensor technologies are currently being considered for the IBL, planar n-on-n slim edge and 3D double sided designs. Results of the characterization, irradiation and beam test studies of IBL pixel devices are presented.

  5. Optimization of linear-logarithmic CMOS image sensor using a photogate and a cascode MOSFET for reducing pixel response variation

    Science.gov (United States)

    Bae, Myunghan; Choi, Byoung-Soo; Kim, Sang-Hwan; Lee, Jimin; Oh, Chang-Woo; Shin, Jang-Kyoo

    2017-02-01

    Recently, CMOS image sensors (CISs) have become more and more complex because they require high-performances such as wide dynamic range, low-noise, high-speed operation, high-resolution and so on. First of all, wide dynamic range (WDR) is the first requirement for high-performance CIS. Several techniques have been proposed to improve the dynamic range. Although logarithmic pixel can achieve wide dynamic range, it leads to a poor signal-to-noise ratio due to small output swings. Furthermore, the fixed pattern noise of logarithmic pixel is significantly greater compared with other CISs. In this paper, we propose an optimized linear-logarithmic pixel. Compared to a conventional 3-transistor active pixel sensor structure, the proposed linear-logarithmic pixel is using a photogate and a cascode MOSFET in addition. The photogate which is surrounding a photodiode carries out change of sensitivity in the linear response and thus increases the dynamic range. The logarithmic response is caused by a cascode MOSFET. Although the dynamic range of the pixel has been improved, output curves of each pixel were not uniform. In general, as the number of devices increases in the pixel, pixel response variation is more pronounced. Hence, we optimized the linear-logarithmic pixel structure to minimize the pixel response variation. We applied a hard reset method and an optimized cascode MOSFET to the proposed pixel for reducing pixel response variation. Unlike the conventional reset operation, a hard reset using a p-type MOSFET fixes the voltage of each pixel to the same voltage. This reduces non-uniformity of the response in the linear response. The optimized cascode MOSFET achieves less variation in the logarithmic response. We have verified that the optimized pixel shows more uniform response than the conventional pixel, by both simulation and experiment.

  6. A high performance multi-tap CMOS lock-in pixel image sensor for biomedical applications

    Science.gov (United States)

    Seo, Min-Woong; Shirakawa, Yuya; Kagawa, Keiichiro; Yasutomi, Keita; Kawahito, Shoji

    2017-02-01

    We have developed and evaluated the large full well capacity (FWC) for wide signal detection range and low temporal noise for high sensitivity lock-in pixel CMOS image sensor (CIS) embedded with two storage-diodes (SDs). In addition, for fast charge transfer from photodiode (PD) to SDs, a lateral electric field charge modulator (LEFM) is used for the developed lock-in pixel. As a result, the time-resolved CIS achieves a very large FWC of approximately 7000e-, low temporal random noise of 1.17e-rms at 45fps with true correlated double sampling (CDS) operation, and fast intrinsic response less than 500ps at 635nm. The proposed imager has an effective pixel array of 128(H)×256(V) and a pixel size of 11.2×11.2μm2. The sensor chip is fabricated by a Dongbu HiTek 1P4M 0.11μm CIS process.

  7. Development of CMOS pixel sensors for tracking and vertexing in high energy physics experiments

    CERN Document Server

    AUTHOR|(CDS)2070112; Besson, Auguste; Claus, Giles; Cousin, Loic; Dulinski, Wojciech; Goffe, Mathieu; Hippolyte, Boris; Maria, Robert; Molnar, Levente; Sanchez Castro, Xitzel; Winter, Marc

    2014-01-01

    CMOS pixel sensors (CPS) represent a novel technological approach to building charged particle detectors. CMOS processes allow to integrate a sensing volume and readout electronics in a single silicon die allowing to build sensors with a small pixel pitch ($\\sim 20 \\mu m$) and low material budget ($\\sim 0.2-0.3\\% X_0$) per layer. These characteristics make CPS an attractive option for vertexing and tracking systems of high energy physics experiments. Moreover, thanks to the mass production industrial CMOS processes used for the manufacturing of CPS the fabrication construction cost can be significantly reduced in comparison to more standard semiconductor technologies. However, the attainable performance level of the CPS in terms of radiation hardness and readout speed is mostly determined by the fabrication parameters of the CMOS processes available on the market rather than by the CPS intrinsic potential. The permanent evolution of commercial CMOS processes towards smaller feature sizes and high resistivity ...

  8. Development of active edge pixel sensors and four-side buttable modules using vertical integration technologies

    CERN Document Server

    INSPIRE-00219560; Moser, H.-G.; Nisius, R.; Richter, R.H.; Terzo, S.; Weigell, P.

    2014-01-01

    We present an R&D activity focused on the development of novel modules for the upgrade of the ATLAS pixel system at the High Luminosity LHC (HL-LHC). The modules consist of n-in-p pixel sensors, 100 or 200 $\\mu$m thick, produced at VTT (Finland) with an active edge technology, which considerably reduces the dead area at the periphery of the device. The sensors are interconnected with solder bump-bonding to the ATLAS FE-I3 and FE-I4 read-out chips, and characterized with radioactive sources and beam tests at the CERN-SPS and DESY. The results of these measurements will be discussed for devices before and after irradiation up to a fluence of $5\\times 10^{15}$ \

  9. A CMOS image sensor using high-speed lock-in pixels for stimulated Raman scattering

    Science.gov (United States)

    Lioe, DeXing; Mars, Kamel; Takasawa, Taishi; Yasutomi, Keita; Kagawa, Keiichiro; Hashimoto, Mamoru; Kawahito, Shoji

    2016-03-01

    A CMOS image sensor using high-speed lock-in pixels for stimulated Raman scattering (SRS) spectroscopy is presented in this paper. The effective SRS signal from the stimulated emission of SRS mechanism is very small in contrast to the offset of a probing laser source, which is in the ratio of 10-4 to 10-5. In order to extract this signal, the common offset component is removed, and the small difference component is sampled using switched-capacitor integrator with a fully differential amplifier. The sampling is performed over many integration cycles to achieve appropriate amplification. The lock-in pixels utilizes high-speed lateral electric field charge modulator (LEFM) to demodulate the SRS signal which is modulated at high-frequency of 20MHz. A prototype chip is implemented using 0.11μm CMOS image sensor technology.

  10. Recent results of the ATLAS Upgrade Planar Pixel Sensors R&D Project

    CERN Document Server

    AUTHOR|(CDS)2073610

    2011-01-01

    The ATLAS detector has to undergo significant updates at the end of the current decade, in order to withstand the increased occupancy and radiation damage that will be produced by the high-luminosity upgrade of the Large Hadron Collider. In this presentation we give an overview of the recent accomplishments of the R&D activity on the planar pixel sensors for the ATLAS Inner Detector upgrade.

  11. Giga-pixel lensfree holographic microscopy and tomography using color image sensors.

    Directory of Open Access Journals (Sweden)

    Serhan O Isikman

    Full Text Available We report Giga-pixel lensfree holographic microscopy and tomography using color sensor-arrays such as CMOS imagers that exhibit Bayer color filter patterns. Without physically removing these color filters coated on the sensor chip, we synthesize pixel super-resolved lensfree holograms, which are then reconstructed to achieve ~350 nm lateral resolution, corresponding to a numerical aperture of ~0.8, across a field-of-view of ~20.5 mm(2. This constitutes a digital image with ~0.7 Billion effective pixels in both amplitude and phase channels (i.e., ~1.4 Giga-pixels total. Furthermore, by changing the illumination angle (e.g., ± 50° and scanning a partially-coherent light source across two orthogonal axes, super-resolved images of the same specimen from different viewing angles are created, which are then digitally combined to synthesize tomographic images of the object. Using this dual-axis lensfree tomographic imager running on a color sensor-chip, we achieve a 3D spatial resolution of ~0.35 µm × 0.35 µm × ~2 µm, in x, y and z, respectively, creating an effective voxel size of ~0.03 µm(3 across a sample volume of ~5 mm(3, which is equivalent to >150 Billion voxels. We demonstrate the proof-of-concept of this lensfree optical tomographic microscopy platform on a color CMOS image sensor by creating tomograms of micro-particles as well as a wild-type C. elegans nematode.

  12. Development of CMOS Pixel Sensors fully adapted to the ILD Vertex Detector Requirements

    CERN Document Server

    Winter, Marc; Besson, Auguste; Claus, Gilles; Dorokhov, Andrei; Goffe, Mathieu; Hu-Guo, Christine; Morel, Frederic; Valin, Isabelle; Voutsinas, Georgios; Zhang, Liang

    2012-01-01

    CMOS Pixel Sensors are making steady progress towards the specifications of the ILD vertex detector. Recent developments are summarised, which show that these devices are close to comply with all major requirements, in particular the read-out speed needed to cope with the beam related background. This achievement is grounded on the double- sided ladder concept, which allows combining signals generated by a single particle in two different sensors, one devoted to spatial resolution and the other to time stamp, both assembled on the same mechanical support. The status of the development is overviewed as well as the plans to finalise it using an advanced CMOS process.

  13. Design of a radiation hard silicon pixel sensor for X-ray science

    Energy Technology Data Exchange (ETDEWEB)

    Schwandt, Joern

    2014-06-15

    At DESY Hamburg the European X-ray Free-Electron Laser (EuXFEL) is presently under construction. The EuXFEL has unique properties with respect to X-ray energy, instantaneous intensity, pulse length, coherence and number of pulses/sec. These properties of the EuXFEL pose very demanding requirements for imaging detectors. One of the detector systems which is currently under development to meet these challenges is the Adaptive Gain Integrating Pixel Detector, AGIPD. It is a hybrid pixel-detector system with 1024 x 1024 p{sup +} pixels of dimensions 200 μm x 200 μm, made of 16 p{sup +}nn{sup +}- silicon sensors, each with 10.52 cm x 2.56 cm sensitive area and 500 μm thickness. The particular requirements for the AGIPD are a separation between noise and single photons down to energies of 5 keV, more than 10{sup 4} photons per pixel for a pulse duration of less than 100 fs, negligible pile-up at the EuXFEL repetition rate of 4.5 MHz, operation for X-ray doses up to 1 GGy, good efficiency for X-rays with energies between 5 and 20 keV, and minimal inactive regions at the edges. The main challenge in the sensor design is the required radiation tolerance and high operational voltage, which is required to reduce the so-called plasma effect. This requires a specially optimized sensor. The X-ray radiation damage results in a build-up of oxide charges and interface traps which lead to a reduction of the breakdown voltage, increased leakage current, increased interpixel capacitances and charge losses. Extensive TCAD simulations have been performed to understand the impact of X-ray radiation damage on the detector performance and optimize the sensor design. To take radiation damage into account in the simulation, radiation damage parameters have been determined on MOS capacitors and gate-controlled diodes as function of dose. The optimized sensor design was fabricated by SINTEF. Irradiation tests on test structures and sensors show that the sensor design is radiation hard and

  14. Monolithic active pixel sensor development for the upgrade of the ALICE inner tracking system

    Science.gov (United States)

    Aglieri, G.; Cavicchioli, C.; Chalmet, P. L.; Chanlek, N.; Collu, A.; Giubilato, P.; Hillemanns, H.; Junique, A.; Keil, M.; Kim, D.; Kim, J.; Kugathasan, T.; Lattuca, A.; Mager, M.; Marin Tobon, C. A.; Marras, D.; Martinengo, P.; Mattiazzo, S.; Mazza, G.; Mugnier, H.; Musa, L.; Pantano, D.; Puggioni, C.; Rousset, J.; Reidt, F.; Riedler, P.; Siddhanta, S.; Snoeys, W.; Usai, G.; van Hoorne, J. W.; Yang, P.; Yi, J.

    2013-12-01

    ALICE plans an upgrade of its Inner Tracking System for 2018. The development of a monolithic active pixel sensor for this upgrade is described. The TowerJazz 180 nm CMOS imaging sensor process has been chosen as it is possible to use full CMOS in the pixel due to the offering of a deep pwell and also to use different starting materials. The ALPIDE development is an alternative to approaches based on a rolling shutter architecture, and aims to reduce power consumption and integration time by an order of magnitude below the ALICE specifications, which would be quite beneficial in terms of material budget and background. The approach is based on an in-pixel binary front-end combined with a hit-driven architecture. Several prototypes have already been designed, submitted for fabrication and some of them tested with X-ray sources and particles in a beam. Analog power consumption has been limited by optimizing the Q/C of the sensor using Explorer chips. Promising but preliminary first results have also been obtained with a prototype ALPIDE. Radiation tolerance up to the ALICE requirements has also been verified.

  15. On drift fields in CMOS Monolithic Active Pixel Sensors with point-like collection diodes

    CERN Document Server

    Deveaux, M; Dorokhov, A; Doering, D; Heymes, J; Kachel, M; Koziel, M; Linnik, B; Müntz, C; Stroth, J

    2016-01-01

    CMOS Monolithic Active Pixel Sensors for charged particle tracking are considered as technology for numerous experiments in heavy ion and particle physics. To match the requirements for those applications in terms of tolerance to non-ionizing radiation, it is being tried to deplete the sensitive volume of the, traditionally non-depleted, silicon sensors. We study the feasibility of this approach for the common case that the collection diodes of the pixel are small as compared to the pixel pitch. An analytic equation predicting the thickness of the depletion depth and the capacity of this point-like junction is introduced. We find that the predictions of this equations differs qualitatively from the usual results for flat PN junctions and that $dC/dU$-measurements are not suited to measure the depletion depth of diodes with point-like geometry. The predictions of the equation is compared with measurements on the depletion depth of CMOS sensors, which were carried out with a novel measurement protocol. It is fo...

  16. Development of active edge pixel sensors and four-side buttable modules using vertical integration technologies

    Science.gov (United States)

    Macchiolo, A.; Andricek, L.; Moser, H.-G.; Nisius, R.; Richter, R. H.; Terzo, S.; Weigell, P.

    2014-11-01

    We present an R&D activity focused on the development of novel modules for the upgrade of the ATLAS pixel system at the High Luminosity LHC (HL-LHC). The modules consist of n-in-p pixel sensors, 100 or 200 μm thick, produced at VTT (Finland) with an active edge technology, which considerably reduces the dead area at the periphery of the device. The sensors are interconnected with solder bump-bonding to the ATLAS FE-I3 and FE-I4 read-out chips, and characterised with radioactive sources and beam tests at the CERN-SPS and DESY. The results of these measurements will be discussed for devices before and after irradiation up to a fluence of 5 ×1015neq /cm2. We will also report on the R&D activity to obtain Inter Chip Vias (ICVs) on the ATLAS read-out chip in collaboration with the Fraunhofer Institute EMFT. This step is meant to prove the feasibility of the signal transport to the newly created readout pads on the backside of the chips allowing for four side buttable devices without the presently used cantilever for wire bonding. The read-out chips with ICVs will be interconnected to thin pixel sensors, 75 μm and 150 μm thick, with the Solid Liquid Interdiffusion (SLID) technology, which is an alternative to the standard solder bump-bonding.

  17. A highly pixelated CdZnTe detector based on \\textit{Topmetal-${II}^-$} sensor

    CERN Document Server

    Zou, Shuguang; Sun, Xiangming; Huang, Guangming; Pei, Hua; Wang, Zhen; Liu, Jun; Yang, Ping; Wang, Dong

    2016-01-01

    \\textit{Topmetal-${II}^-$} is a low noise CMOS pixel direct charge sensor with a pitch of 83$\\mu m$. CdZnTe is an excellent semiconductor material for radiation detection. The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution. In our experiments, an epoxy adhesive is used as the conductive medium to connect the sensor and CdZnTe. The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of -2 Volts, and the image of a single alpha is clear with a reasonable spatial resolution. The detector of such structure has the potential to be applied in X-ray imaging systems with a further improvements of the sensor.

  18. Geo-processing workflow driven wildfire hot pixel detection under sensor web environment

    Science.gov (United States)

    Chen, Nengcheng; Di, Liping; Yu, Genong; Gong, Jianya

    2010-03-01

    Integrating Sensor Web Enablement (SWE) services with Geo-Processing Workflows (GPW) has become a bottleneck for Sensor Web-based applications, especially remote-sensing observations. This paper presents a common GPW framework for Sensor Web data service as part of the NASA Sensor Web project. This abstract framework includes abstract GPW model construction, GPW chains from service combination, and data retrieval components. The concrete framework consists of a data service node, a data processing node, a data presentation node, a Catalogue Service node, and a BPEL engine. An abstract model designer is used to design the top level GPW model, a model instantiation service is used to generate the concrete Business Process Execution Language (BPEL), and the BPEL execution engine is adopted. This framework is used to generate several kinds of data: raw data from live sensors, coverage or feature data, geospatial products, or sensor maps. A prototype, including a model designer, model instantiation service, and GPW engine-BPELPower is presented. A scenario for an EO-1 Sensor Web data service for wildfire hot pixel detection is used to test the feasibility of the proposed framework. The execution time and influences of the EO-1 live Hyperion data wildfire classification service framework are evaluated. The benefits and high performance of the proposed framework are discussed. The experiments of EO-1 live Hyperion data wildfire classification service show that this framework can improve the quality of services for sensor data retrieval and processing.

  19. Processing and characterization of a MEDIPIX2-compatible silicon sensor with 220 {mu}m pixel size

    Energy Technology Data Exchange (ETDEWEB)

    Froejdh, Anna; Froejdh, Erik; Thungstroem, Goeran; Froejdh, Christer [Department of Information Technology and Media, Mid-Sweden University, SE-85170 Sundsvall (Sweden); Norlin, Boerje, E-mail: Borje.Norlin@miun.se [Department of Information Technology and Media, Mid-Sweden University, SE-85170 Sundsvall (Sweden)

    2011-05-15

    Pixellated silicon detectors with a pixel size of 220 {mu}m have been fabricated at Mid-Sweden University. The purpose was to make a detector compatible with the MEDIPIX2 readout chip with pixels large enough to avoid charge sharing to do spectral imaging. Two different guard ring structures have been tested to investigate leakage current and interpixel isolation in a sensor made on high resistivity silicon.

  20. A CMOS image sensor with draining only modulation pixels for fluorescence lifetime imaging

    Science.gov (United States)

    Li, Zhuo; Yasutomi, Keita; Takasawa, Taishi; Itoh, Shinya; Kawahito, Shoji

    2011-03-01

    Fluorescence lifetime imaging is becoming a powerful tool in biology. A charge-domain CMOS Fluorescence Lifetime Imaging Microscopy (FLIM) chip using a pinned photo diode (PPD) and the pinned storage diode (PSD) with different depth of potential wells has been previously developed by the authors. However, a transfer gate between PPD and PSD causes charge transfer noise due to traps at the channel surface. This paper presents a time-resolved CMOS image sensor with draining only modulation pixels for fluorescence lifetime imaging, which removes the transfer gate between PPD and PSD. The time windowing is done by draining with a draining gate only, which is attached along the carrier path from PPD to PSD. This allows us to realize a trapping less charge transfer between PPD and PSD, leading to a very low-noise time-resolved signal detection. A video-rate CMOS FLIM chip has been fabricated using 0.18μm standard CMOS pinned diode image sensor process. The pixel consists of a PPD, a PSD, a charge draining gate (TD), a readout transfer gate (TX) between the PSD and the floating diffusion (FD), a reset transistor and a source follower amplifier transistor. The pixel array has 200(Row) x 256(Column) pixels and the pixel pitch is 7.5μm. Fundamental characteristics of the implemented CMOS FLIM chip are measured. The signal intensity of the PSD as a function of the TD gate voltage is also measured. The ratio of the signal for the TD off to the signal for the TD on is 212 : 1.

  1. Development of radiation tolerant monolithic active pixel sensors with fast column parallel read-out

    Science.gov (United States)

    Koziel, M.; Dorokhov, A.; Fontaine, J.-C.; De Masi, R.; Winter, M.

    2010-12-01

    Monolithic active pixel sensors (MAPS) [1] (Turchetta et al., 2001) are being developed at IPHC—Strasbourg to equip the EUDET telescope [2] (Haas, 2006) and vertex detectors for future high energy physics experiments, including the STAR upgrade at RHIC [3] (T.S. Collaboration, 2005) and the CBM experiment at FAIR/GSI [4] (Heuser, 2006). High granularity, low material budget and high read-out speed are systematically required for most applications, complemented, for some of them, with high radiation tolerance. A specific column-parallel architecture, implemented in the MIMOSA-22 sensor, was developed to achieve fast read-out MAPS. Previous studies of the front-end architecture integrated in this sensor, which includes in-pixel amplification, have shown that the fixed pattern noise increase consecutive to ionizing radiation can be controlled by means of a negative feedback [5] (Hu-Guo et al., 2008). However, an unexpected rise of the temporal noise was observed. A second version of this chip (MIMOSA-22bis) was produced in order to search for possible improvements of the radiation tolerance, regarding this type of noise. In this prototype, the feedback transistor was tuned in order to mitigate the sensitivity of the pixel to ionizing radiation. The performances of the pixels after irradiation were investigated for two types of feedback transistors: enclosed layout transistor (ELT) [6] (Snoeys et al., 2000) and "standard" transistor with either large or small transconductance. The noise performance of all test structures was studied in various conditions (expected in future experiments) regarding temperature, integration time and ionizing radiation dose. Test results are presented in this paper. Based on these observations, ideas for further improvement of the radiation tolerance of column parallel MAPS are derived.

  2. CMOS image sensor with lateral electric field modulation pixels for fluorescence lifetime imaging with sub-nanosecond time response

    Science.gov (United States)

    Li, Zhuo; Seo, Min-Woong; Kagawa, Keiichiro; Yasutomi, Keita; Kawahito, Shoji

    2016-04-01

    This paper presents the design and implementation of a time-resolved CMOS image sensor with a high-speed lateral electric field modulation (LEFM) gating structure for time domain fluorescence lifetime measurement. Time-windowed signal charge can be transferred from a pinned photodiode (PPD) to a pinned storage diode (PSD) by turning on a pair of transfer gates, which are situated beside the channel. Unwanted signal charge can be drained from the PPD to the drain by turning on another pair of gates. The pixel array contains 512 (V) × 310 (H) pixels with 5.6 × 5.6 µm2 pixel size. The imager chip was fabricated using 0.11 µm CMOS image sensor process technology. The prototype sensor has a time response of 150 ps at 374 nm. The fill factor of the pixels is 5.6%. The usefulness of the prototype sensor is demonstrated for fluorescence lifetime imaging through simulation and measurement results.

  3. Cost effective flip chip assembly and interconnection technologies for large area pixel sensor applications

    Energy Technology Data Exchange (ETDEWEB)

    Fritzsch, T., E-mail: thomas.fritzsch@izm.fraunhofer.de [Fraunhofer IZM, Gustav-Meyer-Allee 25, Berlin 13355 (Germany); Jordan, R.; Oppermann, H. [Fraunhofer IZM, Gustav-Meyer-Allee 25, Berlin 13355 (Germany); Ehrmann, O. [Berlin Institute of Technology (TUB), Berlin 10623 (Germany); Toepper, M.; Baumgartner, T.; Lang, K.-D. [Fraunhofer IZM, Gustav-Meyer-Allee 25, Berlin 13355 (Germany)

    2011-09-11

    Much of the cost of manufacturing pixel detectors is due to bumping and flip chip assembly of the readout chips onto sensor tiles, even if it is done on wafer level. To address this issue, Fraunhofer IZM investigated two new technological approaches, namely screen printing using dry film resist and chip-to-wafer assembly. In the first approach, solder bumps with diameters of 80 and 25 {mu}m in pitches of 110 and 60 {mu}m, respectively, were produced by screen-printing solder paste using a photo-structured dry film resist. Results indicated that the technology is a viable high yield and low cost bumping process. The second approach was developed to decrease the number of manual handling steps in pixel module manufacturing, which is critical for reducing processing time and cost. Here, chip designs on 200 mm readout chip (ROC) wafers and 150 mm sensor wafers were especially adapted for chip-to-wafer assembly and to ensure that the interconnection yield and reliability could be tested. After bumping and dicing of the readout chip wafer and UBM plating on the sensor wafer, individual dice were flip chip mounted on the pre-diced sensor wafer. This paper describes the technological steps, key processing parameters and first results for both technologies.

  4. Characterisation of a CMOS Active Pixel Sensor for use in the TEAM Microscope

    CERN Document Server

    Battaglia, Marco; Denes, Peter; Doering, Dionisio; Duden, Thomas; Krieger, Brad; Giubilato, Piero; Gnani, Dario; Radmilovic, Velimir

    2010-01-01

    A 1M- and a 4M-pixel monolithic CMOS active pixel sensor with 9.5x9.5 micron^2 pixels have been developed for direct imaging in transmission electron microscopy as part of the TEAM project. We present the design and a full characterisation of the detector. Data collected with electron beams at various energies of interest in electron microscopy are used to determine the detector response. Data are compared to predictions of simulation. The line spread function measured with 80 keV and 300 keV electrons is (12.1+/-0.7) micron and (7.4+/-0.6) micron, respectively, in good agreement with our simulation. We measure the detection quantum efficiency to be 0.78+/-0.04 at 80 keV and 0.74+/-0.03 at 300 keV. Using a new imaging technique, based on single electron reconstruction, the line spread function for 80 keV and 300 keV electrons becomes (6.7+/-0.3) micron and (2.4+/-0.2) micron, respectively. The radiation tolerance of the pixels has been tested up to 5 Mrad and the detector is still functional with a decrease o...

  5. Characterisation of a CMOS active pixel sensor for use in the TEAM microscope

    Energy Technology Data Exchange (ETDEWEB)

    Battaglia, Marco, E-mail: MBattaglia@lbl.go [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Santa Cruz Institute of Particle Physics, University of California at Santa Cruz, CA 95064 (United States); Contarato, Devis; Denes, Peter; Doering, Dionisio; Duden, Thomas; Krieger, Brad [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Giubilato, Piero [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Dipartimento di Fisica, Universita degli Studi, Padova I-35131 (Italy); Gnani, Dario; Radmilovic, Velimir [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

    2010-10-21

    A 1M- and a 4M-pixel monolithic CMOS active pixel sensor with 9.5x9.5{mu}m{sup 2} pixels have been developed for direct imaging in transmission electron microscopy as part of the TEAM project. We present the design and a full characterisation of the detector. Data collected with electron beams at various energies of interest in electron microscopy are used to determine the detector response. Data are compared to predictions of simulation. The line spread function measured with 80 and 300 keV electrons is (12.1{+-}0.7) and (7.4{+-}0.6){mu}m, respectively, in good agreement with our simulation. We measure the detection quantum efficiency to be 0.78{+-}0.04 at 80 keV and 0.74{+-}0.03 at 300 keV. Using a new imaging technique, based on single electron reconstruction, the line spread function for 80 and 300 keV electrons becomes (6.7{+-}0.3) and (2.4{+-}0.2){mu}m, respectively. The radiation tolerance of the pixels has been tested up to 5 Mrad and the detector is still functional with a decrease of dynamic range by {approx_equal}30%, corresponding to a reduction in full-well depth from {approx}39 to {approx}27 primary 300 keV electrons, due to leakage current increase, but identical line spread function performance.

  6. The ALPIDE pixel sensor chip for the upgrade of the ALICE Inner Tracking System

    CERN Document Server

    Aglieri Rinella, Gianluca

    2016-01-01

    The ALPIDE chip is a CMOS Monolithic Active Pixel Sensor being developed for the Upgrade of the ITS of the ALICE experiment at the CERN Large Hadron Collider. The ALPIDE chip is implemented with a 180 nm CMOS Imaging Process and fabricated on substrates with a high-resistivity epitaxial layer. It measures 15 mm×30 mm and contains a matrix of 512×1024 pixels with in-pixel amplification, shaping, discrimination and multi-event buffering. The readout of the sensitive matrix is hit driven. There is no signaling activity over the matrix if there are no hits to read out and power consumption is proportional to the occupancy. The sensor meets the experimental requirements of detection efficiency above 99%, fake-hit probability below 10−5 and a spatial resolution of 5 μm. The capability to read out Pb–Pb interactions at 100 kHz is provided. The power density of the ALPIDE chip is projected to be less than 35 mW/cm2 for the application in the Inner Barrel Layers and below 20 mW/cm2 for the Outer Barrel Layers, ...

  7. The ALPIDE pixel sensor chip for the upgrade of the ALICE Inner Tracking System

    Science.gov (United States)

    Aglieri Rinella, Gianluca

    2017-02-01

    The ALPIDE chip is a CMOS Monolithic Active Pixel Sensor being developed for the Upgrade of the ITS of the ALICE experiment at the CERN Large Hadron Collider. The ALPIDE chip is implemented with a 180 nm CMOS Imaging Process and fabricated on substrates with a high-resistivity epitaxial layer. It measures 15 mm×30 mm and contains a matrix of 512×1024 pixels with in-pixel amplification, shaping, discrimination and multi-event buffering. The readout of the sensitive matrix is hit driven. There is no signaling activity over the matrix if there are no hits to read out and power consumption is proportional to the occupancy. The sensor meets the experimental requirements of detection efficiency above 99%, fake-hit probability below 10-5 and a spatial resolution of 5 μm. The capability to read out Pb-Pb interactions at 100 kHz is provided. The power density of the ALPIDE chip is projected to be less than 35 mW/cm2 for the application in the Inner Barrel Layers and below 20 mW/cm2 for the Outer Barrel Layers, where the occupancy is lower. This contribution describes the architecture and the main features of the final ALPIDE chip, planned for submission at the beginning of 2016. Early results from the experimental qualification of full scale prototype predecessors are also reported.

  8. M.i.p. detection performances of a 100 us read-out CMOS pixel sensor with digitised outputs

    CERN Document Server

    Winter, Marc; Besson, Auguste; Colledani, Claude; Degerli, Yavuz; De Masi, Rita; Dorokhov, Andrei; Doziere, Guy; Dulinski, Wojciech; Gelin, Marie; Guilloux, Fabrice; Himmi, Abdelkader; Hu-Guo, Christine; Morel, Frederic; Orsini, Fabienne; Valin, Isabelle; Voutsinas, Georgios

    2009-01-01

    Swift, high resolution CMOS pixel sensors are being developed for the ILC vertex detector, aiming to allow approaching the interaction point very closely. A major issue is the time resolution of the sensors needed to deal with the high occupancy generated by the beam related background. A 128x576 pixel sensor providing digitised outputs at a read-out time of 92.5 us, was fabricated in 2008 within the EU project EUDET, and tested with charged particles at the CERN-SPS. Its prominent performances in terms of noise, detection efficiency versus fake hit rate, spatial resolution and radiation tolerance are overviewed. They validate the sensor architecture.

  9. Performance of a novel wafer scale CMOS active pixel sensor for bio-medical imaging.

    Science.gov (United States)

    Esposito, M; Anaxagoras, T; Konstantinidis, A C; Zheng, Y; Speller, R D; Evans, P M; Allinson, N M; Wells, K

    2014-07-07

    Recently CMOS active pixels sensors (APSs) have become a valuable alternative to amorphous silicon and selenium flat panel imagers (FPIs) in bio-medical imaging applications. CMOS APSs can now be scaled up to the standard 20 cm diameter wafer size by means of a reticle stitching block process. However, despite wafer scale CMOS APS being monolithic, sources of non-uniformity of response and regional variations can persist representing a significant challenge for wafer scale sensor response. Non-uniformity of stitched sensors can arise from a number of factors related to the manufacturing process, including variation of amplification, variation between readout components, wafer defects and process variations across the wafer due to manufacturing processes. This paper reports on an investigation into the spatial non-uniformity and regional variations of a wafer scale stitched CMOS APS. For the first time a per-pixel analysis of the electro-optical performance of a wafer CMOS APS is presented, to address inhomogeneity issues arising from the stitching techniques used to manufacture wafer scale sensors. A complete model of the signal generation in the pixel array has been provided and proved capable of accounting for noise and gain variations across the pixel array. This novel analysis leads to readout noise and conversion gain being evaluated at pixel level, stitching block level and in regions of interest, resulting in a coefficient of variation ⩽1.9%. The uniformity of the image quality performance has been further investigated in a typical x-ray application, i.e. mammography, showing a uniformity in terms of CNR among the highest when compared with mammography detectors commonly used in clinical practice. Finally, in order to compare the detection capability of this novel APS with the technology currently used (i.e. FPIs), theoretical evaluation of the detection quantum efficiency (DQE) at zero-frequency has been performed, resulting in a higher DQE for this

  10. Characterization and performance studies of high-voltage CMOS based pixel sensors

    CERN Document Server

    Smaranda, Dumitru Dan

    2015-01-01

    The high luminosity upgrade of the LHC will push the limits for detectors, specially the silicon trackers which are closest to the interaction point. The ATLAS CMOS Sensor R&D efort is investigating a new technology using high-voltage CMOS processes for producing pixel and strip sensors. In contrast to the currently used technology these devices implement active electronics on the sensor itself, offering a multitude of tuning parameters for achieving the best performance. My summer project revolved around characterising existing samples along with assembling and debugging hardware required for their improvement and functionality. Other tasks involved writing communication protocols using pyBAR to remotely control injection circuitry on a GPAC card, and helping various members of the group with data collection and analysis. Through the summer student programme I have had the opportunity to be part of a vibrant scientic community at the forefront of research, to create bonds with fellow students from univ...

  11. Development of edgeless n-on-p planar pixel sensors for future ATLAS upgrades

    Energy Technology Data Exchange (ETDEWEB)

    Bomben, Marco, E-mail: marco.bomben@cern.ch [Laboratoire de Physique Nucleaire et de Hautes Énergies (LPNHE) Paris (France); Bagolini, Alvise; Boscardin, Maurizio [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM) Povo di Trento (Italy); Bosisio, Luciano [Università di Trieste, Dipartimento di Fisica and INFN, Trieste (Italy); Calderini, Giovanni [Laboratoire de Physique Nucleaire et de Hautes Énergies (LPNHE) Paris (France); Dipartimento di Fisica E. Fermi, Università di Pisa, and INFN Sez. di Pisa, Pisa (Italy); Chauveau, Jacques [Laboratoire de Physique Nucleaire et de Hautes Énergies (LPNHE) Paris (France); Giacomini, Gabriele [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM) Povo di Trento (Italy); La Rosa, Alessandro [Section de Physique (DPNC), Université de Genève, Genève (Switzerland); Marchiori, Giovanni [Laboratoire de Physique Nucleaire et de Hautes Énergies (LPNHE) Paris (France); Zorzi, Nicola [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM) Povo di Trento (Italy)

    2013-06-01

    The development of n-on-p “edgeless” planar pixel sensors being fabricated at FBK (Trento, Italy), aimed at the upgrade of the ATLAS Inner Detector for the High Luminosity phase of the Large Hadron Collider (HL-LHC), is reported. A characterizing feature of the devices is the reduced dead area at the edge, achieved by adopting the “active edge” technology, based on a deep etched trench, suitably doped to make an ohmic contact to the substrate. The project is presented, along with the active edge process, the sensor design for this first n-on-p production and a selection of simulation results, including the expected charge collection efficiency after radiation fluence of 1×10{sup 15}n{sub eq}/cm{sup 2} comparable to those expected at HL-LHC (about ten years of running, with an integrated luminosity of 3000 fb{sup −1}) for the outer pixel layers. We show that, after irradiation and at a bias voltage of 500 V, more than 50% of the signal should be collected in the edge region; this confirms the validity of the active edge approach. -- Highlights: ► We conceive n-on-p edgeless planar silicon sensors. ► These sensors are aimed at the Phase-II of the ATLAS experiment. ► Simulations show sensors can be operated well in overdepletion. ► Simulations show the sensor capability to collect charge at the periphery. ► Simulations prove the above statements to be true even after irradiation.

  12. A novel source–drain follower for monolithic active pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Gao, C., E-mail: chaosong.gao@mails.ccnu.edu.cn [Central China Normal University, Wuhan (China); Aglieri, G.; Hillemanns, H. [CERN, Geneva (Switzerland); Huang, G., E-mail: gmhuang@phy.ccnu.edu.cn [Central China Normal University, Wuhan (China); Junique, A.; Keil, M. [CERN, Geneva (Switzerland); Kim, D. [Dongguk University, Seoul (Korea, Republic of); Yonsei University, Seoul (Korea, Republic of); Kofarago, M.; Kugathasan, T.; Mager, M.; Marin Tobon, C.A.; Martinengo, P. [CERN, Geneva (Switzerland); Mugnier, H. [Mind, Archamps (France); Musa, L. [CERN, Geneva (Switzerland); Lee, S. [Dongguk University, Seoul (Korea, Republic of); Yonsei University, Seoul (Korea, Republic of); Reidt, F. [CERN, Geneva (Switzerland); Ruprecht-Karls-Universitat Heidelberg, Heidelberg (Germany); Riedler, P. [CERN, Geneva (Switzerland); Rousset, J. [Mind, Archamps (France); Sielewicz, K.M. [CERN, Geneva (Switzerland); Warsaw University of Technology, Warsaw (Poland); Snoeys, W. [CERN, Geneva (Switzerland); and others

    2016-09-21

    Monolithic active pixel sensors (MAPS) receive interest in tracking applications in high energy physics as they integrate sensor and readout electronics in one silicon die with potential for lower material budget and cost, and better performance. Source followers (SFs) are widely used for MAPS readout: they increase charge conversion gain 1/C{sub eff} or decrease the effective sensing node capacitance C{sub eff} because the follower action compensates part of the input capacitance. Charge conversion gain is critical for analog power consumption and therefore for material budget in tracking applications, and also has direct system impact. This paper presents a novel source–drain follower (SDF), where both source and drain follow the gate potential improving charge conversion gain. For the inner tracking system (ITS) upgrade of the ALICE experiment at CERN, low material budget is a primary requirement. The SDF circuit was studied as part of the effort to optimize the effective capacitance of the sensing node. The collection electrode, input transistor and routing metal all contribute to C{sub eff}. Reverse sensor bias reduces the collection electrode capacitance. The novel SDF circuit eliminates the contribution of the input transistor to C{sub eff}, reduces the routing contribution if additional shielding is introduced, provides a way to estimate the capacitance of the sensor itself, and has a voltage gain closer to unity than the standard SF. The SDF circuit has a somewhat larger area with a somewhat smaller bandwidth, but this is acceptable in most cases. A test chip, manufactured in a 180 nm CMOS image sensor process, implements small prototype pixel matrices in different flavors to compare the standard SF to the novel SF and to the novel SF with additional shielding. The effective sensing node capacitance was measured using a {sup 55}Fe source. Increasing reverse substrate bias from −1 V to −6 V reduces C{sub eff} by 38% and the equivalent noise charge

  13. Beam Test Studies of 3D Pixel Sensors Irradiated Non-Uniformly for the ATLAS Forward Physics Detector

    CERN Document Server

    Grinstein, S; Boscardin, M; Christophersen, M; Da Via, C; Betta, G -F Dalla; Darbo, G; Fadeyev, V; Fleta, C; Gemme, C; Grenier, P; Jimenez, A; Lopez, I; Micelli, A; Nelist, C; Parker, S; Pellegrini, G; Phlips, B; Pohl, D L; Sadrozinski, H F -W; Sicho, P; Tsiskaridze, S

    2013-01-01

    Pixel detectors with cylindrical electrodes that penetrate the silicon substrate (so called 3D detectors) offer advantages over standard planar sensors in terms of radiation hardness, since the electrode distance is decoupled from the bulk thickness. In recent years significant progress has been made in the development of 3D sensors, which culminated in the sensor production for the ATLAS Insertable B-Layer (IBL) upgrade carried out at CNM (Barcelona, Spain) and FBK (Trento, Italy). Based on this success, the ATLAS Forward Physics (AFP) experiment has selected the 3D pixel sensor technology for the tracking detector. The AFP project presents a new challenge due to the need for a reduced dead area with respect to IBL, and the in-homogeneous nature of the radiation dose distribution in the sensor. Electrical characterization of the first AFP prototypes and beam test studies of 3D pixel devices irradiated non-uniformly are presented in this paper.

  14. Beam test studies of 3D pixel sensors irradiated non-uniformly for the ATLAS forward physics detector

    Energy Technology Data Exchange (ETDEWEB)

    Grinstein, S., E-mail: sgrinstein@ifae.es [ICREA and Institut de Física d' Altes Energies (IFAE), Barcelona (Spain); Baselga, M. [Centro Nacional de Microelectronica, CNM-IMB (CSIC), Barcelona (Spain); Boscardin, M. [Fondazione Bruno Kessler, FBK-CMM, Trento (Italy); Christophersen, M. [U.S. Naval Research Laboratory, Washington (United States); Da Via, C. [School of Physics and Astronomy, University of Manchester, Manchester (United Kingdom); Dalla Betta, G.-F. [Universita degli Studi di Trento and INFN, Trento (Italy); Darbo, G. [INFN Sezione di Genova, Genova (Italy); Fadeyev, V. [Santa Cruz Institute for Particle Physics, University of California, Santa Cruz (United States); Fleta, C. [Centro Nacional de Microelectronica, CNM-IMB (CSIC), Barcelona (Spain); Gemme, C. [Universita degli Studi di Trento and INFN, Trento (Italy); Grenier, P. [SLAC National Accelerator Laboratory, Menlo Park (United States); Jimenez, A.; Lopez, I.; Micelli, A. [ICREA and Institut de Física d' Altes Energies (IFAE), Barcelona (Spain); Nelist, C. [INFN Sezione di Genova, Genova (Italy); Parker, S. [University of Hawaii, c/o Lawrence Berkeley Laboratory, Berkeley (United States); Pellegrini, G. [Centro Nacional de Microelectronica, CNM-IMB (CSIC), Barcelona (Spain); Phlips, B. [U.S. Naval Research Laboratory, Washington (United States); Pohl, D.-L. [University of Bonn, Bonn (Germany); Sadrozinski, H.F.-W. [Santa Cruz Institute for Particle Physics, University of California, Santa Cruz (United States); and others

    2013-12-01

    Pixel detectors with cylindrical electrodes that penetrate the silicon substrate (so called 3D detectors) offer advantages over standard planar sensors in terms of radiation hardness, since the electrode distance is decoupled from the bulk thickness. In recent years significant progress has been made in the development of 3D sensors, which culminated in the sensor production for the ATLAS Insertable B-Layer (IBL) upgrade carried out at CNM (Barcelona, Spain) and FBK (Trento, Italy). Based on this success, the ATLAS Forward Physics (AFP) experiment has selected the 3D pixel sensor technology for the tracking detector. The AFP project presents a new challenge due to the need for a reduced dead area with respect to IBL, and the in-homogeneous nature of the radiation dose distribution in the sensor. Electrical characterization of the first AFP prototypes and beam test studies of 3D pixel devices irradiated non-uniformly are presented in this paper.

  15. Characteristics of non-irradiated and irradiated double SOI integration type pixel sensor

    Science.gov (United States)

    Asano, M.; Sekigawa, D.; Hara, K.; Aoyagi, W.; Honda, S.; Tobita, N.; Arai, Y.; Miyoshi, T.; Kurachi, I.; Tsuboyama, T.; Yamada, M.

    2016-09-01

    We are developing monolithic pixel sensors based on a 0.2 μm fully depleted silicon-on-insulator (FD-SOI) technology for high-energy physics experiment applications. With this SOI technology, the wafer resistivities for the electronics and sensor parts can be chosen separately. Therefore, a device with full depletion and fast charge collection is realized. The total ionizing dose (TID) effect is the major challenge for application in hard radiation environments. To compensate for TID damage, we introduced a double SOI structure that implements an additional middle silicon layer (SOI2 layer). Applying a negative voltage to the SOI2 layer should compensate for the effects induced by holes trapped in the buried oxide layers. We studied the recovery from TID damage induced by 60Co γ and other characteristics of the integration-type double SOI sensor INTPIXh2. When the double SOI sensor was irradiated to 100 kGy, it showed a response to the infrared laser similar to that of a non-irradiated sensor when we applied a negative voltage to the SOI2 layer. Thus, we concluded that the double SOI sensor is very effective at sufficiently enhancing the radiation hardness for application in experiments with harsh radiation environments, such as at Belle II or ILC.

  16. Characteristics of non-irradiated and irradiated double SOI integration type pixel sensor

    Energy Technology Data Exchange (ETDEWEB)

    Asano, M.; Sekigawa, D. [Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8751 (Japan); Hara, K., E-mail: hara@hep.px.tsukuba.ac.jp [Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8751 (Japan); Center for Integrated Research in Fundamental Science and Engineering, University of Tsukuba, Tsukuba, Ibaraki 305-8571 (Japan); Aoyagi, W.; Honda, S.; Tobita, N. [Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8751 (Japan); Arai, Y.; Miyoshi, T.; Kurachi, I.; Tsuboyama, T.; Yamada, M. [Institute of Particle and Nuclear Study, KEK, Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan)

    2016-09-21

    We are developing monolithic pixel sensors based on a 0.2 μm fully depleted silicon-on-insulator (FD-SOI) technology for high-energy physics experiment applications. With this SOI technology, the wafer resistivities for the electronics and sensor parts can be chosen separately. Therefore, a device with full depletion and fast charge collection is realized. The total ionizing dose (TID) effect is the major challenge for application in hard radiation environments. To compensate for TID damage, we introduced a double SOI structure that implements an additional middle silicon layer (SOI2 layer). Applying a negative voltage to the SOI2 layer should compensate for the effects induced by holes trapped in the buried oxide layers. We studied the recovery from TID damage induced by {sup 60}Co γ and other characteristics of the integration-type double SOI sensor INTPIXh2. When the double SOI sensor was irradiated to 100 kGy, it showed a response to the infrared laser similar to that of a non-irradiated sensor when we applied a negative voltage to the SOI2 layer. Thus, we concluded that the double SOI sensor is very effective at sufficiently enhancing the radiation hardness for application in experiments with harsh radiation environments, such as at Belle II or ILC.

  17. Detailed study of the column-based priority logic readout of Topmetal-II- CMOS pixel direct charge sensor

    CERN Document Server

    An, Mangmang; Gao, Chaosong; Han, Mikyung; Huang, Guangming; Ji, Rong; Li, Xiaoting; Mei, Yuan; Pei, Hua; Sun, Quan; Sun, Xiangming; Wang, Kai; Xiao, Le; Yang, Ping; Zhang, Wei; Zhou, Wei

    2016-01-01

    We present the detailed study of the digital readout of Topmetal-II- CMOS pixel direct charge sensor. Topmetal-II- is an integrated sensor with an array of 72X72 pixels each capable of directly collecting external charge through exposed metal electrodes in the topmost metal layer. In addition to the time-shared multiplexing readout of the analog output from Charge Sensitive Amplifiers in each pixel, hits are also generated through comparators with individually DAC settable thresholds in each pixel. The hits are read out via a column-based priority logic structure, retaining both hit location and time information. The in-array column-based priority logic is fully combinational hence there is no clock distributed in the pixel array. Sequential logic and clock are placed on the peripheral of the array. We studied the detailed working behavior and performance of this readout, and demonstrated its potential in imaging applications.

  18. 10×10-pixel 606kS/s multi-point fluorescence correlation spectroscopy CMOS image sensor

    Science.gov (United States)

    Kagawa, Keiichiro; Takasawa, Taishi; Bo, Zhang; Seo, Min-Woong; Imai, Kaita; Yamamoto, Jotaro; Kinjo, Masataka; Terakawa, Susumu; Yasutomi, Keita; Kawahito, Shoji

    2014-03-01

    To observe molecular transport in a living cell, a high-speed CMOS image sensor for multi-point fluorescence correlation spectroscopy is developed. To achieve low-noise and high-speed simultaneously, a prototype CMOS image sensor is designed based on a complete pixel-parallel architecture and multi-channel pipelined pixel readout. The prototype chip with 10×10 effective pixels is fabricated in 0.18-μm CMOS image sensor technology. The pixel pitch and the photosensitive area are 56μm and 10μm in diameter without a microlens, respectively. In the experiment, the total sampling rate of 606kS/s is achieved. The measured average random noise is 24.9LSB, which is equivalent to about 2.5 electrons in average.

  19. Design and realisation of integrated circuits for the readout of pixel sensors in high-energy physics and biomedical imaging

    Energy Technology Data Exchange (ETDEWEB)

    Peric, I.

    2004-08-01

    Radiation tolerant pixel-readout chip for the ATLAS pixel detector has been designed, implemented in a deep-submicron CMOS technology and successfully tested. The chip contains readout-channels with complex analog and digital circuits. Chip for steering of the DEPFET active-pixel matrix has been implemented in a high-voltage CMOS technology. The chip contains channels which generate fast sequences of high-voltage signals. Detector containing this chip has been successfully tested. Pixel-readout test chip for an X-ray imaging pixel sensor has been designed, implemented in a CMOS technology and tested. Pixel-readout channels are able to simultaneously count the signals generated by passage of individual photons and to sum the total charge generated during exposure time. (orig.)

  20. Simple parallel stream to serial stream converter for Active Pixel Sensor readout

    CERN Document Server

    Kushpil, V; Szelezniak, M

    2009-01-01

    This paper describes a new electronics module for converting a parallel data flow to a serial stream in the USB 2.0 High Speed protocol. The system provides a connection between a PC USB port and a parallel interface of the DAQ board, which is used for investigation of performance of Active Pixel Sensors (APS) prototypes. The DAQ readout software supports Win XX OS and Linux OS. GUI examples have been prepared in the Lab Windows and Lab View environments. The module that was designed using virtual peripheral concept can be easily adapted for many similar tasks.

  1. A Monolithic active pixel sensor for ionizing radiation using a 180nm HV-SOI process

    OpenAIRE

    Hemperek, Tomasz; Kishishita, Tetsuichi; Krüger, Hans; Wermes, Norbert

    2014-01-01

    An improved SOI-MAPS (Silicon On Insulator Monolithic Active Pixel Sensor) for ionizing radiation based on thick-film High Voltage SOI technology (HV-SOI) has been developed. Similar to existing Fully Depleted SOI-based (FD-SOI) MAPS, a buried silicon oxide inter-dielectric (BOX) layer is used to separate the CMOS electronics from the handle wafer which is used as a depleted charge collection layer. FD-SOI MAPS suffer from radiation damage such as transistor threshold voltage shifts due to ch...

  2. Evaluation of the breakdown behaviour of ATLAS silicon pixel sensors after partial guard-ring removal

    Energy Technology Data Exchange (ETDEWEB)

    Goessling, C.; Klingenberg, R. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Muenstermann, D., E-mail: Daniel.Muenstermann@TU-Dortmund.d [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Wittig, T. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany)

    2010-12-11

    To avoid geometrical inefficiencies in the ATLAS pixel detector, the concept of shingling is used up to now in the barrel section. For the upgrades of ATLAS, it is desired to avoid this as it increases the volume and material budget of the pixel layers and complicates the cooling. A direct planar edge-to-edge arrangement of pixel modules has not been possible in the past due to about 1100{mu}m of inactive edge composed of approximately 600{mu}m of guard rings and 500{mu}m of safety margin. In this work, the safety margin and guard rings of ATLAS SingleChip sensors were cut at different positions using a standard diamond dicing saw and irradiated afterwards to explore the breakdown behaviour and the leakage current development. It is found that the inactive edge can be reduced to about 400{mu}m of guard rings with almost no reduction in pre-irradiation testability and leakage current performance. This is in particular important for the insertable b-layer upgrade of ATLAS (IBL) where inactive edges of less than 450{mu}m width are required.

  3. High voltage monolithic active pixel sensors for the PANDA luminosity detector

    Energy Technology Data Exchange (ETDEWEB)

    Weber, Tobias; Feldbauer, Florian; Jasinski, Prometeusz; Leithoff, Heinrich; Motzko, Christof; Fritsch, Miriam [Helmholtz-Institut Mainz and Institut fuer Kernphysik, Universitaet Mainz (Germany); Collaboration: PANDA-Collaboration

    2014-07-01

    The PANDA-Experiment will be part of the new FAIR accelerator center at Darmstadt, Germany. It is a fixed target experiment using a antiproton beam with very high resolution for precision measurements. For a variety of measurements like energy-scans the precise determination of the luminosity is needed. The luminosity detector will determine the luminosity by measuring the angular distribution of elastically scattered antiprotons very close to the beam axis (3-8 mrad). To reconstruct antiproton tracks four layers of thinned silicon sensors with smart pixel readout on chip (HV-MAPS) will be used. Those sensors are currently under development by the Mu3e-collaboration. In the talk the concept of the luminosity measurement is shortly introduced before a summary of the status of HV-MAP prototypes and recent test beam results are presented.

  4. ALPIDE: the Monolithic Active Pixel Sensor for the ALICE ITS upgrade

    Science.gov (United States)

    Šuljić, M.

    2016-11-01

    The upgrade of the ALICE vertex detector, the Inner Tracking System (ITS), is scheduled to be installed during the next long shutdown period (2019-2020) of the CERN Large Hadron Collider (LHC) . The current ITS will be replaced by seven concentric layers of Monolithic Active Pixel Sensors (MAPS) with total active surface of ~10 m2, thus making ALICE the first LHC experiment implementing MAPS detector technology on a large scale. The ALPIDE chip, based on TowerJazz 180 nm CMOS Imaging Process, is being developed for this purpose. A particular process feature, the deep p-well, is exploited so the full CMOS logic can be implemented over the active sensor area without impinging on the deposited charge collection. ALPIDE is implemented on silicon wafers with a high resistivity epitaxial layer. A single chip measures 15 mm by 30 mm and contains half a million pixels distributed in 512 rows and 1024 columns. In-pixel circuitry features amplification, shaping, discrimination and multi-event buffering. The readout is hit driven i.e. only addresses of hit pixels are sent to the periphery. The upgrade of the ITS presents two different sets of requirements for sensors of the inner and of the outer layers due to the significantly different track density, radiation level and active detector surface. The ALPIDE chip fulfils the stringent requirements in both cases. The detection efficiency is higher than 99%, fake-hit probability is orders of magnitude lower than the required 10-6 and spatial resolution within the required 5 μm. This performance is to be maintained even after a total ionising does (TID) of 2.7 Mrad and a non-ionising energy loss (NIEL) fluence of 1.7 × 1013 1 MeV neq/cm2, which is above what is expected during the detector lifetime. Readout rate of 100 kHz is provided and the power density of ALPIDE is less than 40 mW/cm2. This contribution will provide a summary of the ALPIDE features and main test results.

  5. Novel Logarithmic Active Pixel Sensor with High Dynamic Range and High Output Swing

    Institute of Scientific and Technical Information of China (English)

    FU Xian-song; YAO Su-ying; YUAN Yi-dong; XU Jiang-tao; DING Ke; YAN Kun-shan

    2008-01-01

    The logarithmic response complementary metal oxide semiconductor(CMOS) image sensor provides a wide dynamic range, but its drawback is the lack of simple fixed pattern noise(FPN) cancellation scheme. Designed is a novel logarithmic active pixel sensor(APS) with high dynamic range and high output swing. Firstly, the operation principle of mixed-model APS is introduced. The pixel can work in three operation modes by choosing the proper control signals. Then, FPN sources of logarithmic APS are analyzed, and double-sampled technique is implemented to reduce FPN. Finally, according to the simulation results, layout is designed and has passed design rule check(DRC), electronic rule check(ERC) and layout versus schematic(LVS) verifications, and the post-simulation results are basically in agreement with the simulation results. Dynamic range of the new logarithmic APS can reach about 140 dB; and the output swing is about 750 mV. Results show that by using double sampled technique, most FPN is eliminated and the dynamic range is enhanced.

  6. DMAPS: a fully depleted monolithic active pixel sensor - analog performance characterization

    CERN Document Server

    Havránek, Miroslav; Krüger, Hans; Fu, Yunan; Germic, Leonard; Kishishita, Tetsuichi; Obermann, Theresa; Wermes, Norbert

    2014-01-01

    Monolithic Active Pixel Sensors (MAPS) have been developed since the late 1990s based on silicon substrates with a thin epitaxial layer (thickness of 10-15 $\\mu$m) in which charge is collected on an electrode, albeit by disordered and slow diffusion rather than by drift in a directed electric field. As a consequence, the signal is small ($\\approx$ 1000 e$^-$) and the radiation tolerance is much below the LHC requirements by factors of 100 to 1000. In this paper we present the development of a fully Depleted Monolithic Active Pixel Sensors (DMAPS) based on a high resistivity substrate allowing the creation of a fully depleted detection volume. This concept overcomes the inherent limitations of charge collection by diffusion in the standard MAPS designs. We present results from a test chip EPCB01 designed in a commercial 150 nm CMOS technology. The technology provides a thin (50 $\\mu$m) high resistivity n-type silicon substrate as well as an additional deep p-well which allows to integrate full CMOS circuitry i...

  7. Real-time distributed video coding for 1K-pixel visual sensor networks

    Science.gov (United States)

    Hanca, Jan; Deligiannis, Nikos; Munteanu, Adrian

    2016-07-01

    Many applications in visual sensor networks (VSNs) demand the low-cost wireless transmission of video data. In this context, distributed video coding (DVC) has proven its potential to achieve state-of-the-art compression performance while maintaining low computational complexity of the encoder. Despite their proven capabilities, current DVC solutions overlook hardware constraints, and this renders them unsuitable for practical implementations. This paper introduces a DVC architecture that offers highly efficient wireless communication in real-world VSNs. The design takes into account the severe computational and memory constraints imposed by practical implementations on low-resolution visual sensors. We study performance-complexity trade-offs for feedback-channel removal, propose learning-based techniques for rate allocation, and investigate various simplifications of side information generation yielding real-time decoding. The proposed system is evaluated against H.264/AVC intra, Motion-JPEG, and our previously designed DVC prototype for low-resolution visual sensors. Extensive experimental results on various data show significant improvements in multiple configurations. The proposed encoder achieves real-time performance on a 1k-pixel visual sensor mote. Real-time decoding is performed on a Raspberry Pi single-board computer or a low-end notebook PC. To the best of our knowledge, the proposed codec is the first practical DVC deployment on low-resolution VSNs.

  8. Three-dimensional cascaded system analysis of a 50 µm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis.

    Science.gov (United States)

    Zhao, C; Vassiljev, N; Konstantinidis, A C; Speller, R D; Kanicki, J

    2017-03-07

    High-resolution, low-noise x-ray detectors based on the complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology have been developed and proposed for digital breast tomosynthesis (DBT). In this study, we evaluated the three-dimensional (3D) imaging performance of a 50 µm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). The two-dimensional (2D) angle-dependent modulation transfer function (MTF), normalized noise power spectrum (NNPS), and detective quantum efficiency (DQE) were experimentally characterized and modeled using the cascaded system analysis at oblique incident angles up to 30°. The cascaded system model was extended to the 3D spatial frequency space in combination with the filtered back-projection (FBP) reconstruction method to calculate the 3D and in-plane MTF, NNPS and DQE parameters. The results demonstrate that the beam obliquity blurs the 2D MTF and DQE in the high spatial frequency range. However, this effect can be eliminated after FBP image reconstruction. In addition, impacts of the image acquisition geometry and detector parameters were evaluated using the 3D cascaded system analysis for DBT. The result shows that a wider projection angle range (e.g.  ±30°) improves the low spatial frequency (below 5 mm(-1)) performance of the CMOS APS detector. In addition, to maintain a high spatial resolution for DBT, a focal spot size of smaller than 0.3 mm should be used. Theoretical analysis suggests that a pixelated scintillator in combination with the 50 µm pixel pitch CMOS APS detector could further improve the 3D image resolution. Finally, the 3D imaging performance of the CMOS APS and an indirect amorphous silicon (a-Si:H) thin-film transistor (TFT) passive pixel sensor (PPS) detector was simulated and compared.

  9. Three-dimensional cascaded system analysis of a 50 µm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis

    Science.gov (United States)

    Zhao, C.; Vassiljev, N.; Konstantinidis, A. C.; Speller, R. D.; Kanicki, J.

    2017-03-01

    High-resolution, low-noise x-ray detectors based on the complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology have been developed and proposed for digital breast tomosynthesis (DBT). In this study, we evaluated the three-dimensional (3D) imaging performance of a 50 µm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). The two-dimensional (2D) angle-dependent modulation transfer function (MTF), normalized noise power spectrum (NNPS), and detective quantum efficiency (DQE) were experimentally characterized and modeled using the cascaded system analysis at oblique incident angles up to 30°. The cascaded system model was extended to the 3D spatial frequency space in combination with the filtered back-projection (FBP) reconstruction method to calculate the 3D and in-plane MTF, NNPS and DQE parameters. The results demonstrate that the beam obliquity blurs the 2D MTF and DQE in the high spatial frequency range. However, this effect can be eliminated after FBP image reconstruction. In addition, impacts of the image acquisition geometry and detector parameters were evaluated using the 3D cascaded system analysis for DBT. The result shows that a wider projection angle range (e.g.  ±30°) improves the low spatial frequency (below 5 mm-1) performance of the CMOS APS detector. In addition, to maintain a high spatial resolution for DBT, a focal spot size of smaller than 0.3 mm should be used. Theoretical analysis suggests that a pixelated scintillator in combination with the 50 µm pixel pitch CMOS APS detector could further improve the 3D image resolution. Finally, the 3D imaging performance of the CMOS APS and an indirect amorphous silicon (a-Si:H) thin-film transistor (TFT) passive pixel sensor (PPS) detector was simulated and compared.

  10. Radiation hardness studies of n{sup +}-in-n planar pixel sensors for the ATLAS upgrades

    Energy Technology Data Exchange (ETDEWEB)

    Altenheiner, S.; Goessling, C.; Jentzsch, J.; Klingenberg, R. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Muenstermann, D., E-mail: Daniel.Muenstermann@TU-Dortmund.de [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany); Rummler, A.; Troska, G.; Wittig, T. [Lehrstuhl fuer Experimentelle Physik IV, TU Dortmund, 44221 Dortmund (Germany)

    2011-12-01

    The ATLAS experiment at the LHC is planning upgrades of its pixel detector to cope with the luminosity increase foreseen in the coming years within the transition from LHC to Super-LHC (SLHC/HL-LHC). Associated with the increase in instantaneous luminosity is a rise of the target integrated luminosity from 730 to about 3000 fb{sup -1} which directly translates into significantly higher radiation damage. These upgrades consist of the installation of a 4th pixel layer, the insertable b-layer IBL, with a mean sensor radius of only 32 mm from the beam axis, before 2016/17. In addition, the complete pixel detector will be exchanged before 2020/21. Being very close to the beam, the radiation damage of the IBL sensors might be as high as 5 Multiplication-Sign 10{sup 15}n{sub eq}cm{sup -2} at their end-of-life. The total fluence of the innermost pixel layer after the SLHC upgrade might even reach 2 Multiplication-Sign 10{sup 16}n{sub eq}cm{sup -2}. To investigate the radiation hardness and suitability of the current ATLAS pixel sensors for these fluences, n{sup +}-in-n silicon pixel sensors from the ATLAS Pixel production have been irradiated by reactor neutrons to the IBL design fluence and been tested with pions at the SPS and with electrons from a {sup 90}Sr source in the laboratory. The collected charge after IBL fluences was found to exceed 10 000 electrons per MIP at 1 kV of bias voltage which is in agreement with data collected with strip sensors. After SLHC fluences, still reliable operation of the devices could be observed with a collected charge of more than 5000 electrons per MIP.

  11. arXiv The FoCal prototype - an extremely fine-grained electromagnetic calorimeter using CMOS pixel sensors

    CERN Document Server

    Nooren, G.; Peitzmann, T.; Reicher, M.; Rocco, E.; Roehrich, D.; Ullaland, K.; van den Brink, A.; van Leeuwen, M.; Wang, H.; Yang, S.; Zhang, C.

    A prototype of a Si-W EM calorimeter was built with Monolithic Active Pixel Sensors as the active elements. With a pixelsize of 30 $\\mu$m it allows digital calorimetry, i.e. the particles' energy is determined by counting pixels, not by measuring the energy deposited. Although of modest size, only 4 Moliere radii wide, it has 39 million pixels. We describe the construction and tuning of the prototype and present results from beam tests and compare them with predictions of GEANT-based Monte Carlo simulations. We show the shape of showers caused by electrons in unprecedented detail. Results for energy and position resolution will also be given.

  12. Production and Characterisation of SLID Interconnected n-in-p Pixel Modules with 75 Micrometer Thin Silicon Sensors

    CERN Document Server

    Andricek, L; Macchiolo, A.; Moser, H.-G.; Nisius, R.; Richter, R.H.; Terzo, S.; Weigell, P.

    2014-01-01

    The performance of pixel modules built from 75 micrometer thin silicon sensors and ATLAS read-out chips employing the Solid Liquid InterDiffusion (SLID) interconnection technology is presented. This technology, developed by the Fraunhofer EMFT, is a possible alternative to the standard bump-bonding. It allows for stacking of different interconnected chip and sensor layers without destroying the already formed bonds. In combination with Inter-Chip-Vias (ICVs) this paves the way for vertical integration. Both technologies are combined in a pixel module concept which is the basis for the modules discussed in this paper. Mechanical and electrical parameters of pixel modules employing both SLID interconnections and sensors of 75 micrometer thickness are covered. The mechanical features discussed include the interconnection efficiency, alignment precision and mechanical strength. The electrical properties comprise the leakage currents, tunability, charge collection, cluster sizes and hit efficiencies. Targeting at ...

  13. TFA Tanks Focus Area Midyear Review Report FY 1999

    Energy Technology Data Exchange (ETDEWEB)

    SN Schlata

    1999-05-21

    The purpose of the Tanks Focus Area (TFA) Midyear Review was to improve the quality and responsiveness of TFA technical solutions to identified user needs. This review goal was achieved through executing a multi-phased review approach

  14. A novel source-drain follower for monolithic active pixel sensors

    Science.gov (United States)

    Gao, C.; Aglieri, G.; Hillemanns, H.; Huang, G.; Junique, A.; Keil, M.; Kim, D.; Kofarago, M.; Kugathasan, T.; Mager, M.; Marin Tobon, C. A.; Martinengo, P.; Mugnier, H.; Musa, L.; Lee, S.; Reidt, F.; Riedler, P.; Rousset, J.; Sielewicz, K. M.; Snoeys, W.; Sun, X.; Van Hoorne, J. W.; Yang, P.

    2016-09-01

    Monolithic active pixel sensors (MAPS) receive interest in tracking applications in high energy physics as they integrate sensor and readout electronics in one silicon die with potential for lower material budget and cost, and better performance. Source followers (SFs) are widely used for MAPS readout: they increase charge conversion gain 1/Ceff or decrease the effective sensing node capacitance Ceff because the follower action compensates part of the input capacitance. Charge conversion gain is critical for analog power consumption and therefore for material budget in tracking applications, and also has direct system impact. This paper presents a novel source-drain follower (SDF), where both source and drain follow the gate potential improving charge conversion gain. For the inner tracking system (ITS) upgrade of the ALICE experiment at CERN, low material budget is a primary requirement. The SDF circuit was studied as part of the effort to optimize the effective capacitance of the sensing node. The collection electrode, input transistor and routing metal all contribute to Ceff. Reverse sensor bias reduces the collection electrode capacitance. The novel SDF circuit eliminates the contribution of the input transistor to Ceff, reduces the routing contribution if additional shielding is introduced, provides a way to estimate the capacitance of the sensor itself, and has a voltage gain closer to unity than the standard SF. The SDF circuit has a somewhat larger area with a somewhat smaller bandwidth, but this is acceptable in most cases. A test chip, manufactured in a 180 nm CMOS image sensor process, implements small prototype pixel matrices in different flavors to compare the standard SF to the novel SF and to the novel SF with additional shielding. The effective sensing node capacitance was measured using a 55Fe source. Increasing reverse substrate bias from -1 V to -6 V reduces Ceff by 38% and the equivalent noise charge (ENC) by 22% for the standard SF. The SDF

  15. Effect and suppression of parasitic surface damage in neutron irradiated CMOS Monolithic Active Pixel Sensors

    CERN Document Server

    Deveaux, M; Scharrer, P; Stroth, J

    2016-01-01

    CMOS Monolithic Active Pixel Sensors (MAPS) were chosen as sensor technology for the vertex detectors of STAR, CBM and the upgraded ALICE-ITS. They also constitute a valuable option for tracking devices at future e+e- colliders. Those applications require a substantial tolerance to both, ionizing and non-ionizing radiation. To allow for a focused optimization of the radiation tolerance, prototypes are tested by irradiating the devices either with purely ionizing radiation (e.g. soft X-rays) or the most pure sources of non-ionizing radiation available (e.g. reactor neutrons). In the second case, it is typically assumed that the impact of the parasitic $\\gamma$-rays found in the neutron beams is negligible. We checked this assumption by irradiating MAPS with $\\gamma$-rays and comparing the radiation damage generated with the one in neutron irradiated sensors. We conclude that the parasitic radiation doses may cause non-negligible radiation damage. Based on the results we propose a procedure to recognize and to ...

  16. A Measurement of Lorentz Angle and Spatial Resolution of Radiation Hard Silicon Pixel Sensors

    CERN Document Server

    Gorelov, I; Hoeferkamp, M; Seidel, S C; Ciocio, A; Einsweiler, Kevin F; Gilchriese, M G D; Joshi, A; Kleinfelder, S A; Marchesini, R; Milgrome, O; Palaio, N; Pengg, F X; Richardson, J; Zizka, G; Ackers, M; Fischer, P; Keil, M; Meuser, S; Stockmanns, T; Treis, J; Wermes, N; Gössling, C; Hügging, F G; Wüstenfeld, J; Wunstorf, R; Barberis, D; Beccherle, R; Cervetto, M; Darbo, G; Gagliardi, G; Gemme, C; Morettini, P; Netchaeva, P; Osculati, B; Parodi, F; Rossi, L; Dao, K; Fasching, D; Blanquart, L; Breugnon, P; Calvet, D; Clemens, J C; Delpierre, P A; Hallewell, G D; Laugier, D; Mouthuy, T; Rozanov, A N; Trouilleau, C; Valin, I; Aleppo, M; Andreazza, A; Caccia, M; Lari, T; Meroni, C; Ragusa, F; Troncon, C; Vegni, G; Rohe, T; Boyd, G; Severini, H; Skubic, P L; Snow, J; Sícho, P; Tomasek, L; Vrba, V; Holder, M; Lipka, D; Ziolkowski, M; Cauz, D; D'Auria, S; del Papa, C; Grassman, H; Santi, L; Becks, K H; Gerlach, P; Grah, C; Gregor, I; Harenberg, T; Linder, C

    2002-01-01

    Silicon pixel sensors developed by the ATLAS collaboration to meet LHC requirements and to withstand hadronic irradiation to fluences of up to $10^{15} n_eq/cm^{2}$ have been evaluated using a test beam facility at CERN providing a magnetic field. The Lorentz angle was measured and found to alter from 9.0 deg. before irradiation, when the detectors operated at 150 V bias at B=1.48 T, to 3.1 deg after irradiation and operating at 600 V bias at 1.01 T. In addition to the effect due to magnetic field variation, this change is explained by the variation of the electric field inside the detectors arising from the different bias conditions. The depletion depths of irradiated sensors at various bias voltages were also measured. At 600 V bias 280 micron thick sensors depleted to ~200 micron after irradiation at the design fluence of 1 10^{15} 1 MeV n_eq/cm2 and were almost fully depleted at a fluence of 0.5 * 10^{15} 1 MeV n_eq/cm2. The spatial resolution was measured for angles of incidence between 0 deg and 30 deg....

  17. Improved Design of Active Pixel CMOS Sensors for Charged Particle Detection

    Energy Technology Data Exchange (ETDEWEB)

    Deptuch, Grzegorz

    2007-11-12

    The Department of Energy (DOE) nuclear physics program requires developments in detector instrumentation electronics with improved energy, position and timing resolution, sensitivity, rate capability, stability, dynamic range, and background suppression. The current Phase-I project was focused on analysis of standard-CMOS photogate Active Pixel Sensors (APS) as an efficient solution to this challenge. The advantages of the CMOS APS over traditional hybrid approaches (i.e., separate detection regions bump-bonded to readout circuits) include greatly reduced cost, low power and the potential for vastly larger pixel counts and densities. However, challenges remain in terms of the signal-to-noise ratio (SNR) and readout speed (currently on the order of milliseconds), which is the major problem for this technology. Recent work has shown that the long readout time for photogate APS is due to the presence of (interface) traps at the semiconductor-oxide interface. This Phase-I work yielded useful results in two areas: (a) Advanced three-dimensional (3D) physics-based simulation models and simulation-based analysis of the impact of interface trap density on the transient charge collection characteristics of existing APS structures; and (b) Preliminary analysis of the feasibility of an improved photogate pixel structure (i.e., new APS design) with an induced electric field under the charge collecting electrode to enhance charge collection. Significant effort was dedicated in Phase-I to the critical task of implementing accurate interface trap models in CFDRC's NanoTCAD 3D semiconductor device-physics simulator. This resulted in validation of the new NanoTCAD models and simulation results against experimental (published) data, within the margin of uncertainty associated with obtaining device geometry, material properties, and experimentation details. Analyses of the new, proposed photogate APS design demonstrated several promising trends.

  18. Development and Performance of Kyoto's X-ray Astronomical SOI pixel (SOIPIX) sensor

    CERN Document Server

    Tsuru, Takeshi G; Takeda, Ayaki; Tanaka, Takaaki; Nakashima, Shinya; Arai, Yasuo; Mori, Koji; Takenaka, Ryota; Nishioka, Yusuke; Kohmura, Takayoshi; Hatsui, Takaki; Kameshima, Takashi; Ozaki, Kyosuke; Kohmura, Yoshiki; Wagai, Tatsuya; Takei, Dai; Kawahito, Shoji; Kagawa, Keiichiro; Yasutomi, Keita; Kamehama, Hiroki; Shrestha, Sumeet

    2014-01-01

    We have been developing monolithic active pixel sensors, known as Kyoto's X-ray SOIPIXs, based on the CMOS SOI (silicon-on-insulator) technology for next-generation X-ray astronomy satellites. The event trigger output function implemented in each pixel offers microsecond time resolution and enables reduction of the non-X-ray background that dominates the high X-ray energy band above 5--10 keV. A fully depleted SOI with a thick depletion layer and back illumination offers wide band coverage of 0.3--40 keV. Here, we report recent progress in the X-ray SOIPIX development. In this study, we achieved an energy resolution of 300~eV (FWHM) at 6~keV and a read-out noise of 33~e- (rms) in the frame readout mode, which allows us to clearly resolve Mn-K$\\alpha$ and K$\\beta$. Moreover, we produced a fully depleted layer with a thickness of $500~{\\rm \\mu m}$. The event-driven readout mode has already been successfully demonstrated.

  19. Development and performance of Kyoto's x-ray astronomical SOI pixel (SOIPIX) sensor

    Science.gov (United States)

    Tsuru, Takeshi G.; Matsumura, Hideaki; Takeda, Ayaki; Tanaka, Takaaki; Nakashima, Shinya; Arai, Yasuo; Mori, Koji; Takenaka, Ryota; Nishioka, Yusuke; Kohmura, Takayoshi; Hatsui, Takaki; Kameshima, Takashi; Ozaki, Kyosuke; Kohmura, Yoshiki; Wagai, Tatsuya; Takei, Dai; Kawahito, Shoji; Kagawa, Keiichiro; Yasutomi, Keita; Kamehama, Hiroki

    2014-08-01

    We have been developing monolithic active pixel sensors, known as Kyoto's X-ray SOIPIXs, based on the CMOS SOI (silicon-on-insulator) technology for next-generation X-ray astronomy satellites. The event trigger output function implemented in each pixel offers microsecond time resolution and enables reduction of the non-X-ray background that dominates the high X-ray energy band above 5-10 keV. A fully depleted SOI with a thick depletion layer and back illumination offers wide band coverage of 0.3-40 keV. Here, we report recent progress in the X-ray SOIPIX development. In this study, we achieved an energy resolution of 300 eV (FWHM) at 6 keV and a read-out noise of 33 e- (rms) in the frame readout mode, which allows us to clearly resolve Mn-Kα and Kβ. Moreover, we produced a fully depleted layer with a thickness of 500 μm. The event-driven readout mode has already been successfully demonstrated.

  20. Impact of Substrate Bias on Fixed-Pattern-Noise in Active Pixel Sensor Cells

    Science.gov (United States)

    Terauchi, Mamoru

    2007-11-01

    The effect of substrate (body) bias on fixed-pattern-noise (FPN) in active pixel sensor (APS) cells is studied. Through measuring test devices consisting of two metal-oxide-semiconductor field-effect transistors (MOSFETs) connected in series with each of the transistors located in the same well region, it has been revealed that substrate bias, which is inevitably applied in a normal circuit configuration in conventional APS cells, worsens the characteristics fluctuation in source-follower amplifiers in APS cells, leading to FPN that cannot be mitigated by conventional correction methods such as correlated double sampling. In addition it has been confirmed that the current-voltage characteristics of logarithmic converters, each of which is realized using a MOSFET with gate and drain terminals connected together, are also affected by substrate bias, resulting in increased characteristics fluctuation as compared with the case with no substrate bias.

  1. Observation, modeling, and temperature dependence of doubly peaked electric fields in irradiated silicon pixel sensors

    CERN Document Server

    Swartz, M.; Allkofer, Y.; Bortoletto, D.; Cremaldi, L.; Cucciarelli, S.; Dorokhov, A.; Hoermann, C.; Kim, D.; Konecki, M.; Kotlinski, D.; Prokofiev, Kirill; Regenfus, Christian; Rohe, T.; Sanders, D.A.; Son, S.; Speer, T.

    2006-01-01

    We show that doubly peaked electric fields are necessary to describe grazing-angle charge collection measurements of irradiated silicon pixel sensors. A model of irradiated silicon based upon two defect levels with opposite charge states and the trapping of charge carriers can be tuned to produce a good description of the measured charge collection profiles in the fluence range from 0.5x10^{14} Neq/cm^2 to 5.9x10^{14} Neq/cm^2. The model correctly predicts the variation in the profiles as the temperature is changed from -10C to -25C. The measured charge collection profiles are inconsistent with the linearly-varying electric fields predicted by the usual description based upon a uniform effective doping density. This observation calls into question the practice of using effective doping densities to characterize irradiated silicon.

  2. Active Pixel Sensors in ams H18/H35 HV-CMOS Technology for the ATLAS HL-LHC Upgrade

    CERN Document Server

    Ristic, Branislav

    2016-01-01

    Deep sub micron HV-CMOS processes offer the opportunity for sensors built by industry standard techniques while being HV tolerant, making them good candidates for drift-based, fast collecting, thus radiation-hard pixel detectors. For the upgrade of the ATLAS Pixel Detector towards the HL-LHC requirements, active pixel sensors in HV-CMOS technology were investigated. These implement amplifier and discriminator stages directly in insulating deep n-wells, which also act as collecting electrodes. The deep n-wells allow for bias voltages up to 150V leading to a depletion depth of several 10um. Prototype sensors in the ams H18 180nm and H35 350nm HV-CMOS processes have been manufactured, acting as a potential drop-in replacement for the current ATLAS Pixel sensors, thus leaving higher level processing such as trigger handling to dedicated read-out chips. Sensors were thoroughly tested in lab measurements as well as in testbeam experiments. Irradiation with X-rays and protons revealed a tolerance to ionizing doses o...

  3. Design and Optimization of Multi-Pixel Transition-Edge Sensors for X-Ray Astronomy Applications

    Science.gov (United States)

    Smith, Stephen J.; Adams, Joseph S.; Bandler, Simon R.; Chervenak, James A.; Datesman, Aaron Michael; Eckart, Megan E.; Ewin, Audrey J.; Finkbeiner, Fred M.; Kelley, Richard L.; Kilbourne, Caroline A.; hide

    2017-01-01

    Multi-pixel transition-edge sensors (TESs), commonly referred to as 'hydras', are a type of position sensitive micro-calorimeter that enables very large format arrays to be designed without commensurate increase in the number of readout channels and associated wiring. In the hydra design, a single TES is coupled to discrete absorbers via varied thermal links. The links act as low pass thermal filters that are tuned to give a different characteristic pulse shape for x-ray photons absorbed in each of the hydra sub pixels. In this contribution we report on the experimental results from hydras consisting of up to 20 pixels per TES. We discuss the design trade-offs between energy resolution, position discrimination and number of pixels and investigate future design optimizations specifically targeted at meeting the readout technology considered for Lynx.

  4. Characterization of thin irradiated epitaxial silicon sensors for the CMS phase II pixel upgrade

    CERN Document Server

    Centis Vignali, Matteo; Eichhorn, Thomas; Garutti, Erika; Junkes, Alexandra; Steinbrueck, Georg

    2015-01-01

    The high-luminosity upgrade fo the large hadron collider foreseen for 2023 resulted in the decision to replace the tracker system of the CMS experiment. The innermost layer of the new pixel detector will experience fluences in the order of $\\phi_{eq} \\approx 10^{16}$~cm$^{-2}$ and a dose of $\\approx 5$~MGy after an integrated luminosity of 3000~fb$^{-1}$. Several materials and designs are under investigation in order to build a detector that can withstand such high fluences. Thin planar silicon sensors are good canditates to achieve this goal since the degradation of the signal produced by traversing particles is less severe than for thicker devices. A study has been carried out in order to characterize highly irradiated planar epitaxial silicon sensors with an active thickness of 100~$\\mu$m. The investigation includes pad diodes and strip detectors irradiated up to a fluence of $\\phi_{eq} = 1.3 \\times 10^{16}$~cm$^{-2}$. The electrical properties of diodes have bee...

  5. Test-beam measurements and simulation studies of thin pixel sensors for the CLIC vertex detector

    CERN Document Server

    AUTHOR|(INSPIRE)INSPIRE-00574329; Dannheim, Dominik

    The multi-$TeV$ $e^{+}e^{-}$ Compact Linear Collider (CLIC) is one of the options for a future high-energy collider for the post-LHC era. It would allow for searches of new physics and simultaneously offer the possibility for precision measurements of standard model processes. The physics goals and experimental conditions at CLIC set high precision requirements on the vertex detector made of pixel detectors: a high pointing resolution of 3 $\\mu m$, very low mass of 0.2% $X_{0}$ per layer, 10 ns time stamping capability and low power dissipation of 50 mW/$cm^{2}$ compatible with air-flow cooling. In this thesis, hybrid assemblies with thin active-edge planar sensors are characterised through calibrations, laboratory and test-beam measurements. Prototypes containing 50 $\\mu m$ to 150 $\\mu m$ thin planar silicon sensors bump-bonded to Timepix3 readout ASICs with 55 $\\mu m$ pitch are characterised in test beams at the CERN SPS in view of their detection efficiency and single-point resolution. A digitiser for AllP...

  6. 50 μm pixel pitch wafer-scale CMOS active pixel sensor x-ray detector for digital breast tomosynthesis.

    Science.gov (United States)

    Zhao, C; Konstantinidis, A C; Zheng, Y; Anaxagoras, T; Speller, R D; Kanicki, J

    2015-12-07

    Wafer-scale CMOS active pixel sensors (APSs) have been developed recently for x-ray imaging applications. The small pixel pitch and low noise are very promising properties for medical imaging applications such as digital breast tomosynthesis (DBT). In this work, we evaluated experimentally and through modeling the imaging properties of a 50 μm pixel pitch CMOS APS x-ray detector named DynAMITe (Dynamic Range Adjustable for Medical Imaging Technology). A modified cascaded system model was developed for CMOS APS x-ray detectors by taking into account the device nonlinear signal and noise properties. The imaging properties such as modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE) were extracted from both measurements and the nonlinear cascaded system analysis. The results show that the DynAMITe x-ray detector achieves a high spatial resolution of 10 mm(-1) and a DQE of around 0.5 at spatial frequencies  CMOS APS x-ray detector, image aquisition geometry and image reconstruction techniques should be considered.

  7. First functionality tests of a 64 × 64 pixel DSSC sensor module connected to the complete ladder readout

    Science.gov (United States)

    Donato, M.; Hansen, K.; Kalavakuru, P.; Kirchgessner, M.; Kuster, M.; Porro, M.; Reckleben, C.; Turcato, M.

    2017-03-01

    The European X-ray Free Electron Laser (XFEL.EU) will provide every 0.1 s a train of 2700 spatially coherent ultrashort X-ray pulses at 4.5 MHz repetition rate. The Small Quantum Systems (SQS) instrument and the Spectroscopy and Coherent Scattering instrument (SCS) operate with soft X-rays between 0.5 keV-6 keV. The DEPFET Sensor with Signal Compression (DSSC) detector is being developed to meet the requirements set by these two XFEL.EU instruments. The DSSC imager is a 1 mega-pixel camera able to store up to 800 single-pulse images per train. The so-called ladder is the basic unit of the DSSC detector. It is the single unit out of sixteen identical-units composing the DSSC-megapixel camera, containing all representative electronic components of the full-size system and allows testing the full electronic chain. Each DSSC ladder has a focal plane sensor with 128× 512 pixels. The read-out ASIC provides full-parallel readout of the sensor pixels. Every read-out channel contains an amplifier and an analog filter, an up-to 9 bit ADC and the digital memory. The ASIC amplifier have a double front-end to allow one to use either DEPFET sensors or Mini-SDD sensors. In the first case, the signal compression is a characteristic intrinsic of the sensor; in the second case, the compression is implemented at the first amplification stage. The goal of signal compression is to meet the requirement of single-photon detection capability and wide dynamic range. We present the first results of measurements obtained using a 64× 64 pixel DEPFET sensor attached to the full final electronic and data-acquisition chain.

  8. Depth-of-interaction estimates in pixelated scintillator sensors using Monte Carlo techniques

    Science.gov (United States)

    Sharma, Diksha; Sze, Christina; Bhandari, Harish; Nagarkar, Vivek; Badano, Aldo

    2017-01-01

    Image quality in thick scintillator detectors can be improved by minimizing parallax errors through depth-of-interaction (DOI) estimation. A novel sensor for low-energy single photon imaging having a thick, transparent, crystalline pixelated micro-columnar CsI:Tl scintillator structure has been described, with possible future application in small-animal single photon emission computed tomography (SPECT) imaging when using thicker structures under development. In order to understand the fundamental limits of this new structure, we introduce cartesianDETECT2, an open-source optical transport package that uses Monte Carlo methods to obtain estimates of DOI for improving spatial resolution of nuclear imaging applications. Optical photon paths are calculated as a function of varying simulation parameters such as columnar surface roughness, bulk, and top-surface absorption. We use scanning electron microscope images to estimate appropriate surface roughness coefficients. Simulation results are analyzed to model and establish patterns between DOI and photon scattering. The effect of varying starting locations of optical photons on the spatial response is studied. Bulk and top-surface absorption fractions were varied to investigate their effect on spatial response as a function of DOI. We investigated the accuracy of our DOI estimation model for a particular screen with various training and testing sets, and for all cases the percent error between the estimated and actual DOI over the majority of the detector thickness was ±5% with a maximum error of up to ±10% at deeper DOIs. In addition, we found that cartesianDETECT2 is computationally five times more efficient than MANTIS. Findings indicate that DOI estimates can be extracted from a double-Gaussian model of the detector response. We observed that our model predicts DOI in pixelated scintillator detectors reasonably well.

  9. Characterization of the column-based priority logic readout of Topmetal-II‑ CMOS pixel direct charge sensor

    Science.gov (United States)

    An, M.; Zhang, W.; Xiao, L.; Gao, C.; Chen, C.; Han, M.; Huang, G.; Ji, R.; Li, X.; Liu, J.; Mei, Y.; Pei, H.; Sun, Q.; Sun, X.; Wang, K.; Yang, P.; Zhou, W.

    2017-03-01

    We present the detailed study of the digital readout of Topmetal-II- CMOS pixel direct charge sensor. Topmetal-II- is an integrated sensor with an array of 72×72 pixels each capable of directly collecting external charge through exposed metal electrodes in the topmost metal layer. In addition to the time-shared multiplexing readout of the analog output from Charge Sensitive Amplifiers in each pixel, hits are also generated through comparators in each pixel with individually adjustable thresholds. The hits are read out via a column-based priority logic structure, retaining both hit location and time information. The in-array column-based priority logic features with a full clock-less circuitry hence there is no continuously running clock distributed in the pixel and matrix logic. These characteristics enable its use as the charge readout device in future Time Projection Chambers without gaseous gain mechanism, which has unique advantages in low background and low rate-density experiments. We studied the detailed working behavior and performance of this readout, and demonstrated its functional validity and potential in imaging applications.

  10. Integrated X-ray and charged particle active pixel CMOS sensor arrays using an epitaxial silicon sensitive region

    Energy Technology Data Exchange (ETDEWEB)

    Kleinfelder, Stuart; Bichsel, Hans; Bieser, Fred; Matis, Howard S.; Rai, Gulshan; Retiere, Fabrice; Weiman, Howard; Yamamoto, Eugene

    2002-07-01

    Integrated CMOS Active Pixel Sensor (APS) arrays have been fabricated and tested using X-ray and electron sources. The 128 by 128 pixel arrays, designed in a standard 0.25 micron process, use a {approx}10 micron epitaxial silicon layer as a deep detection region. The epitaxial layer has a much greater thickness than the surface features used by standard CMOS APS, leading to stronger signals and potentially better signal-to-noise ratio (SNR). On the other hand, minority carriers confined within the epitaxial region may diffuse to neighboring pixels, blur images and reduce peak signal intensity. But for low-rate, sparse-event images, centroid analysis of this diffusion may be used to increase position resolution. Careful trade-offs involving pixel size and sense-node area verses capacitance must be made to optimize overall performance. The prototype sensor arrays, therefore, include a range of different pixel designs, including different APS circuits and a range of different epitaxial layer contact structures. The fabricated arrays were tested with 1.5 GeV electrons and Fe-55 X-ray sources, yielding a measured noise of 13 electrons RMS and an SNR for single Fe-55 X-rays of greater than 38.

  11. Development of Edgeless Silicon Pixel Sensors on p-type substrate for the ATLAS High-Luminosity Upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Calderini, G. [Laboratoire de Physique Nucléaire et des Hautes Energies (LPNHE), Paris (France); Dipartimento di Fisica E. Fermi, Universitá di Pisa, Pisa (Italy); Bagolini, A. [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM), Povo di Trento (Italy); Beccherle, R. [Istituto Nazionale di Fisica Nucleare, Sez. di Pisa (Italy); Bomben, M. [Laboratoire de Physique Nucléaire et des Hautes Energies (LPNHE), Paris (France); Boscardin, M. [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM), Povo di Trento (Italy); Bosisio, L. [Università degli studi di Trieste (Italy); INFN-Trieste (Italy); Chauveau, J. [Laboratoire de Physique Nucléaire et des Hautes Energies (LPNHE), Paris (France); Giacomini, G. [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM), Povo di Trento (Italy); La Rosa, A. [Section de Physique (DPNC), Universitè de Geneve, Geneve (Switzerland); Marchiori, G. [Laboratoire de Physique Nucléaire et des Hautes Energies (LPNHE), Paris (France); Zorzi, N. [Fondazione Bruno Kessler, Centro per i Materiali e i Microsistemi (FBK-CMM), Povo di Trento (Italy)

    2016-09-21

    In view of the LHC upgrade phases towards the High Luminosity LHC (HL-LHC), the ATLAS experiment plans to upgrade the Inner Detector with an all-silicon system. The n-on-p silicon technology is a promising candidate to achieve a large area instrumented with pixel sensors, since it is radiation hard and cost effective. The presentation describes the performance of novel n-in-p edgeless planar pixel sensors produced by FBK-CMM, making use of the active trench for the reduction of the dead area at the periphery of the device. After discussing the sensor technology, some feedback from preliminary results of the first beam test will be discussed.

  12. Development of Edgeless Silicon Pixel Sensors on p-type substrate for the ATLAS High-Luminosity Upgrade

    Science.gov (United States)

    Calderini, G.; Bagolini, A.; Beccherle, R.; Bomben, M.; Boscardin, M.; Bosisio, L.; Chauveau, J.; Giacomini, G.; La Rosa, A.; Marchiori, G.; Zorzi, N.

    2016-09-01

    In view of the LHC upgrade phases towards the High Luminosity LHC (HL-LHC), the ATLAS experiment plans to upgrade the Inner Detector with an all-silicon system. The n-on-p silicon technology is a promising candidate to achieve a large area instrumented with pixel sensors, since it is radiation hard and cost effective. The presentation describes the performance of novel n-in-p edgeless planar pixel sensors produced by FBK-CMM, making use of the active trench for the reduction of the dead area at the periphery of the device. After discussing the sensor technology, some feedback from preliminary results of the first beam test will be discussed.

  13. Development of thin sensors and a novel interconnection technology for the upgrade of the ATLAS pixel system

    Energy Technology Data Exchange (ETDEWEB)

    Beimforde, Michael

    2010-07-19

    To extend the discovery potential of the experiments at the LHC accelerator a two phase luminosity upgrade towards the super LHC (sLHC) with a maximum instantaneous luminosity of 10{sup 35}/cm{sup 2}s{sup 1} is planned. Retaining the reconstruction efficiency and spatial resolution of the ATLAS tracking detector at the sLHC, new pixel modules have to be developed that have a higher granularity, can be placed closer to the interaction point, and allow for a cost-efficient coverage of a larger pixel detector volume compared to the present one. The reduced distance to the interaction point calls for more compact modules that have to be radiation hard to supply a sufficient charge collection efficiency up to an integrated particle fluence equivalent to that of (1-2).10{sup 16} 1-MeV-neutrons per square centimeter (n{sub eq}/cm{sup 2}). Within this thesis a new module concept was partially realised and evaluated for the operation within an ATLAS pixel detector at the sLHC. This module concept utilizes a novel thin sensor production process for thin n-in-p silicon sensors which potentially allow for a higher radiation hardness at a reduced cost. Furthermore, the new 3D-integration technology ICV-SLID is explored which will allow for increasing the active area of the modules from 71% to about 90% and hence, for employing the modules in the innermost layer of the upgraded ATLAS pixel detector. A semiconductor simulation and measurements of irradiated test sensors are used to optimize the implantation parameters for the inter-pixel isolation of the thin sensors. These reduce the crosstalk between the pixel channels and should allow for operating the sensors during the whole runtime of the experiment without causing junction breakdowns. The characterization of the first production of sensors with active thicknesses of 75 {mu}m and 150 {mu}m proved that thin pixel sensors can be successfully produced with the new process technology. Thin pad sensors with a reduced inactive

  14. Performance of Edgeless Silicon Pixel Sensors on p-type substrate for the ATLAS High-Luminosity Upgrade

    CERN Document Server

    INSPIRE-00052711; Boscardin, Maurizio; Bosisio, Luciano; Calderini, Giovanni; Chauveau, Jacques; Ducourthial, Audrey; Giacomini, Gabriele; Marchiori, Giovanni; Zorzi, Nicola

    2016-01-01

    In view of the LHC upgrade phases towards the High Luminosity LHC (HL-LHC), the ATLAS experiment plans to upgrade the Inner Detector with an all-silicon system. The n-on-p silicon technology is a promising candidate to achieve a large area instrumented with pixel sensors, since it is radiation hard and cost effective. The paper reports on the performance of novel n-on-p edgeless planar pixel sensors produced by FBK-CMM, making use of the active trench for the reduction of the dead area at the periphery of the device. After discussing the sensor technology an overview of the first beam test results will be given.

  15. Supporting drivable region detection by minimising salient pixels generated through robot sensors

    CSIR Research Space (South Africa)

    Falola, O

    2010-11-01

    Full Text Available serves to provide an assistive pre-processing strategy for the detection of drivable region through minimisation of salient pixels in a colour feature extraction. Salient pixels are pixels occupying the non-drivable region particularly those having same...

  16. 16k pixel digital line-scan sensor with 12bit resolution and 40kS/second

    Science.gov (United States)

    Wäny, Martin; Franco, Paulo; Voltz, Stephan

    2009-02-01

    This paper presents a digital line-scan sensor in standard CMOS technology for high resolution scanning application in machine vision, mainly surface inspection of large panel and web materials. The sensor however has due to the unprecedented resolution also application potential in earth observation and motion picture context. The sensor features 16384 charge integrating pixels of 3.5um x 3.5um photo active area. Each pixel has it's own charge integrating transconductance amplifier circuit, a true correlated double sampling stage, sample & hold stage and a pixel level 13 bit linear AD converter. Readout is performed over 16 parallel digital output tap's operated at 50MHz pixel clock. The sensor generates at maximum speed a total data rate of 10.4Gbit/s. In order to maximize the integration time, data readout, AD conversion and integration can be performed simultaneously. Therefore even at the maximum line rate of 43kScans/second the integration time can be maintained at 20us. In order to accommodate for different application scenarios with very different lighting budget's, the sensors full well capacity can be programmed by means of a two step programmable gain from 3000e- to 40ke-. The prototype characterization results showed a total quantum efficiency of 72% at 625nm. With the full well capacity set to 26ke- the conversion gain was measured to be 0.13DN/e- with a read noise in dark of 1.7DN, or 12 e- dark noise equivalent. Over all DSNU is reduced to 3DN rms independent of the conversion gain by the on chip combination of CDS and digital DSNU correction. PRNU was measured according the EMVA1288 standard to 1.2% rms. The sensor is mounted on an "Invar" enforced COB board without glass cover for reduced reflections on optical interface stacks. Instead of traditional package leads SMD mounted board to board connectors are used for the electrical connections.

  17. Test beam evaluation of newly developed n-in-p planar pixel sensors for use in a high radiation environment

    Science.gov (United States)

    Kimura, K.; Yamaguchi, D.; Motohashi, K.; Nakamura, K.; Unno, Y.; Jinnouchi, O.; Altenheiner, S.; Blue, A.; Bomben, M.; Butter, A.; Cervelli, A.; Crawley, S.; Ducourthial, A.; Gisen, A.; Hagihara, M.; Hanagaki, K.; Hara, K.; Hirose, M.; Homma, Y.; Ikegami, Y.; Kamada, S.; Kono, T.; Macchiolo, A.; Marchiori, G.; Meloni, F.; Milovanovic, M.; Morton, A.; Mullier, G.; Munoz, F. J.; Nellist, C.; Paschen, B.; Quadt, A.; Rashid, T.; Rieger, J.; Rummler, A.; Sato, K.; Sato, K.; Savic, N.; Sawai, H.; Sexton, K.; Stramaglia, M. E.; Swiatlowski, M.; Takashima, R.; Takubo, Y.; Terzo, S.; Todome, K.; Tojo, J.; Houten, K. Van; Weingarten, J.; Wonsak, S.; Wraight, K.; Yamamura, K.

    2016-09-01

    Radiation-tolerant n-in-p planar pixel sensors have been under development in cooperation with Hamamatsu Photonics K.K. (HPK). This is geared towards applications in high-radiation environments, such as for the future Inner Tracker (ITk) placed in the innermost part of the ATLAS detector in the high luminosity LHC (HL-LHC) experiment. Prototypes of those sensors have been produced, irradiated, and evaluated over the last few years. In the previous studies, it was reported that significant drops in the detection efficiency were observed after irradiation, especially under bias structures. The bias structures are made up of poly-Si or Al bias rails and poly-Si bias resistors. The structure is implemented on the sensors to allow quality checks to be performed before the bump-bonding process, and to ensure that charge generated in floating pixels due to non-contacting or missing bump-bonds is dumped in a controlled way in order to avoid noise. To minimize the efficiency drop, several new pixel structures have been designed with bias rails and bias resistors relocated. Several test beams have been carried out to evaluate the drops in the detection efficiency of the new sensor structures after irradiation. Newly developed sensor modules were irradiated with proton-beams at the Cyclotron and Radio-Isotope Center (CYRIC) in Tohoku University to see the effect of sensor-bulk damage and surface charge-up. An irradiation with γ-rays was also carried out at Takasaki Advanced Radiation Research Center, with the goal of decoupling the effect of surface charge-up from that of bulk damage. Those irradiated sensors have been evaluated with particle beams at DESY and CERN. Comparison between different sensor structures confirmed significant improvements in minimizing efficiency loss under the bias structures after irradiation. The results from γ-irradiation also enabled cross-checking the results of a semiconductor technology simulation program (TCAD).

  18. A Monolithic active pixel sensor for ionizing radiation using a 180nm HV-SOI process

    CERN Document Server

    Hemperek, Tomasz; Krüger, Hans; Wermes, Norbert

    2014-01-01

    An improved SOI-MAPS (Silicon On Insulator Monolithic Active Pixel Sensor) for ionizing radiation based on Partially Depleted High Voltage SOI technology (PD-SOI) has been developed. Similar to existing Fully Depleted SOI-based (FD-SOI) MAPS, a buried silicon oxide inter-dielectric (BOX) layer is used to separate the CMOS electronics from the handle wafer which is used as a depleted charge collection layer while FD-SOI MAPS suffer from radiation damage such as transistor threshold voltage shifts due to charge traps in the oxide layers and charge states created at the silicon oxide boundaries (back gate effect). The XFAB 180-nm HV-SOI technology offers an additional isolation by deep non-depleted implant between the BOX layer and the active circuitry witch mitigates this problem. Therefore we see in this technology a high potential to implement radiation-tolerant MAPS with fast charge collection property. The design and measurement results from a first prototype are presented including charge collection in neu...

  19. A Monolithic Active Pixel Sensor for ionizing radiation using a 180 nm HV-SOI process

    Science.gov (United States)

    Hemperek, Tomasz; Kishishita, Tetsuichi; Krüger, Hans; Wermes, Norbert

    2015-10-01

    An improved SOI-MAPS (Silicon On Insulator Monolithic Active Pixel Sensor) for ionizing radiation based on thick-film High Voltage SOI technology (HV-SOI) has been developed. Similar to existing Fully Depleted SOI-based (FD-SOI) MAPS, a buried silicon oxide inter-dielectric (BOX) layer is used to separate the CMOS electronics from the handle wafer which is used as a depleted charge collection layer. FD-SOI MAPS suffers from radiation damage such as transistor threshold voltage shifts due to charge traps in the oxide layers and charge states created at the silicon oxide boundaries (back gate effect). The X-FAB 180-nm HV-SOI technology offers an additional isolation by deep non-depleted implant between the BOX layer and the active circuitry which mitigates this problem. Therefore we see in this technology a high potential to implement radiation-tolerant MAPS with fast charge collection property. The design and measurement results from a first prototype are presented including charge collection in neutron irradiated samples.

  20. Active pixel sensors in AMS H18/H35 HV-CMOS technology for the ATLAS HL-LHC upgrade

    Science.gov (United States)

    Ristic, Branislav

    2016-09-01

    Deep sub micron HV-CMOS processes offer the opportunity for sensors built by industry standard techniques while being HV tolerant, making them good candidates for drift-based, fast collecting, thus radiation-hard pixel detectors. For the upgrade of the ATLAS Pixel Detector towards the HL-LHC requirements, active pixel sensors in HV-CMOS technology were investigated. These implement signal processing electronics in deep n-wells, which also act as collecting electrodes. The deep n-wells allow for bias voltages up to 150 V leading to a depletion depth of several 10 μm. Prototype sensors in the AMS H18 180 nm and H35 350 nm HV-CMOS processes were thoroughly tested in lab measurements as well as in testbeam experiments. Irradiations with X-rays and protons revealed a tolerance to ionizing doses of 1 Grad while Edge-TCT studies assessed the effects of radiation on the charge collection. The sensors showed high detection efficiencies after neutron irradiation to 1015neq cm-2 in testbeam experiments. A full reticle size demonstrator chip, implemented in the H35 process is being submitted to prove the large scale feasibility of the HV-CMOS concept.

  1. A wide dynamic range CMOS image sensor with dual charge storage in a pixel and a multiple sampling technique

    Science.gov (United States)

    Shafie, Suhaidi; Kawahito, Shoji

    2008-02-01

    This paper presents a dynamic range expansion technique of CMOS image sensors with dual charge storage in a pixel and multiple exposures. Each pixel contains two photodiodes, PD1 and PD2 whose sensitivity can be set independently by the accumulation time. The difference of charge accumulation time in both photodiode can be manipulated to expand the dynamic range of the sensor. It allows flexible control of the dynamic range since the accumulation time in PD2 is adjustable. The multiple exposure technique used in the sensor reduces the motion blur in the synthesized wide dynamic range image when capturing fast-moving objects. It also reduces the signal-to-nose ratio dip at the switching point of the PD1 signal to the PD2 signals in the synthesized wide dynamic range image. A wide dynamic range camera with 320x240 pixels image sensor has been tested. It is found that the sampling of 4 times for the short accumulation time signals is sufficient for the reduction of motion blur in the synthesized wide dynamic range image, and the signal-to-noise ratio dip at the switching point of the PD1 signal to the PD2 signal is improved by 6 dB using 4 short-time exposures.

  2. Test beam evaluation of newly developed n-in-p planar pixel sensors for use in a high radiation environment

    Energy Technology Data Exchange (ETDEWEB)

    Kimura, K., E-mail: kimihiko@hep.phys.titech.ac.jp [Institute of Science and Engineering, Tokyo Institute of Technology, Ookayama 2-12-1, Meguro-ku, Tokyo 152-8551 (Japan); Yamaguchi, D.; Motohashi, K. [Institute of Science and Engineering, Tokyo Institute of Technology, Ookayama 2-12-1, Meguro-ku, Tokyo 152-8551 (Japan); Nakamura, K.; Unno, Y. [Institute of Particle and Nuclear Study, KEK, Oho 1-1, Tsukuba, Ibaraki 305-0801 (Japan); Jinnouchi, O. [Institute of Science and Engineering, Tokyo Institute of Technology, Ookayama 2-12-1, Meguro-ku, Tokyo 152-8551 (Japan); Altenheiner, S. [Experimentelle Physik IV, Technische Universität Dortmund, 44221 Dortmund (Germany); Blue, A. [School of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, Scotland (United Kingdom); Bomben, M. [CNRS/IN2P3 (France); Laboratoire de physique nucléaire et de hautes energies (LPNHE), Univ. Paris-UMPC, 4 Place Jussieu, 75005 Paris (France); Univ. Paris Diderot (France); Butter, A. [LAL, University Paris-Sud (France); CNRS/IN2P3 (France); Université Paris-Saclay, Orsay (France); Cervelli, A. [Universität Bern, Laboratory for High Energy Physics, Sidlerstrasse 55, CH-3012 Bern (Switzerland); Crawley, S. [School of Physics and Astronomy, University of Glasgow, Glasgow, G12 8QQ, Scotland (United Kingdom); Ducourthial, A. [CNRS/IN2P3 (France); Laboratoire de physique nucléaire et de hautes energies (LPNHE), Univ. Paris-UMPC, 4 Place Jussieu, 75005 Paris (France); Univ. Paris Diderot (France); Gisen, A. [Experimentelle Physik IV, Technische Universität Dortmund, 44221 Dortmund (Germany); Hagihara, M. [Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8751 (Japan); and others

    2016-09-21

    Radiation-tolerant n-in-p planar pixel sensors have been under development in cooperation with Hamamatsu Photonics K.K. (HPK). This is geared towards applications in high-radiation environments, such as for the future Inner Tracker (ITk) placed in the innermost part of the ATLAS detector in the high luminosity LHC (HL-LHC) experiment. Prototypes of those sensors have been produced, irradiated, and evaluated over the last few years. In the previous studies, it was reported that significant drops in the detection efficiency were observed after irradiation, especially under bias structures. The bias structures are made up of poly-Si or Al bias rails and poly-Si bias resistors. The structure is implemented on the sensors to allow quality checks to be performed before the bump-bonding process, and to ensure that charge generated in floating pixels due to non-contacting or missing bump-bonds is dumped in a controlled way in order to avoid noise. To minimize the efficiency drop, several new pixel structures have been designed with bias rails and bias resistors relocated. Several test beams have been carried out to evaluate the drops in the detection efficiency of the new sensor structures after irradiation. Newly developed sensor modules were irradiated with proton-beams at the Cyclotron and Radio-Isotope Center (CYRIC) in Tohoku University to see the effect of sensor-bulk damage and surface charge-up. An irradiation with γ-rays was also carried out at Takasaki Advanced Radiation Research Center, with the goal of decoupling the effect of surface charge-up from that of bulk damage. Those irradiated sensors have been evaluated with particle beams at DESY and CERN. Comparison between different sensor structures confirmed significant improvements in minimizing efficiency loss under the bias structures after irradiation. The results from γ-irradiation also enabled cross-checking the results of a semiconductor technology simulation program (TCAD). - Highlights: • The

  3. Studies Of Radiation Effects On Pixel Sensors For The Cms Experiment And Design Of Radiation Hard Sensors For Future Upgrades Of Lhc Upgrade

    CERN Document Server

    Roy, A

    2005-01-01

    The CMS experiment which is currently under construction at the Large Hadron Collider (LHC) at CERN (Geneva, Switzerland) will contain a pixel detector that provides in its final configuration three space points per track close to the interaction point of the colliding beams. The readout chip is expected to survive a particle fluence of 6 × 1014 neq/cm2 and therefore all components of the hybrid pixel detector have to perform well up to at least this fluence. This requires the silicon to operate partially depleted after irradiation and therefore “n in n” concept has been chosen. In order to perform IV tests on wafers to certify the quality of sensors and to hold accidentally unconnected pixels close to ground potential a resistive path between the pixels has been implemented by openings in the p -stop implants surrounding every pixel cell. Prototypes of such sensors have been produced by two different companies and their properties have been extensively tested before and after ir...

  4. SEMICONDUCTOR DEVICES: Two-dimensional pixel image lag simulation and optimization in a 4-T CMOS image sensor

    Science.gov (United States)

    Junting, Yu; Binqiao, Li; Pingping, Yu; Jiangtao, Xu; Cun, Mou

    2010-09-01

    Pixel image lag in a 4-T CMOS image sensor is analyzed and simulated in a two-dimensional model. Strategies of reducing image lag are discussed from transfer gate channel threshold voltage doping adjustment, PPD N-type doping dose/implant tilt adjustment and transfer gate operation voltage adjustment for signal electron transfer. With the computer analysis tool ISE-TCAD, simulation results show that minimum image lag can be obtained at a pinned photodiode n-type doping dose of 7.0 × 1012 cm-2, an implant tilt of -2°, a transfer gate channel doping dose of 3.0 × 1012 cm-2 and an operation voltage of 3.4 V. The conclusions of this theoretical analysis can be a guideline for pixel design to improve the performance of 4-T CMOS image sensors.

  5. Development of CdTe pixel detectors combined with an aluminum Schottky diode sensor and photon-counting ASICs

    Science.gov (United States)

    Toyokawa, H.; Saji, C.; Kawase, M.; Wu, S.; Furukawa, Y.; Kajiwara, K.; Sato, M.; Hirono, T.; Shiro, A.; Shobu, T.; Suenaga, A.; Ikeda, H.

    2017-01-01

    We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 μ m by 200 μm and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20 degrees C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.

  6. Production and characterisation of SLID interconnected n-in-p pixel modules with 75 μm thin silicon sensors

    Energy Technology Data Exchange (ETDEWEB)

    Andricek, L. [Halbleiterlabor der Max-Planck-Gesellschaft, Otto Hahn Ring 6, D-81739 München (Germany); Beimforde, M.; Macchiolo, A.; Moser, H.-G. [Max-Planck-Institut für Physik (Werner-Heisenberg-Institut), Föhringer Ring 6, D-80805 München (Germany); Nisius, R., E-mail: Richard.Nisius@mpp.mpg.de [Max-Planck-Institut für Physik (Werner-Heisenberg-Institut), Föhringer Ring 6, D-80805 München (Germany); Richter, R.H. [Halbleiterlabor der Max-Planck-Gesellschaft, Otto Hahn Ring 6, D-81739 München (Germany); Terzo, S.; Weigell, P. [Max-Planck-Institut für Physik (Werner-Heisenberg-Institut), Föhringer Ring 6, D-80805 München (Germany)

    2014-09-11

    The performance of pixel modules built from 75 μm thin silicon sensors and ATLAS read-out chips employing the Solid Liquid InterDiffusion (SLID) interconnection technology is presented. This technology, developed by the Fraunhofer EMFT, is a possible alternative to the standard bump-bonding. It allows for stacking of different interconnected chip and sensor layers without destroying the already formed bonds. In combination with Inter-Chip-Vias (ICVs) this paves the way for vertical integration. Both technologies are combined in a pixel module concept which is the basis for the modules discussed in this paper. Mechanical and electrical parameters of pixel modules employing both SLID interconnections and sensors of 75 μm thickness are covered. The mechanical features discussed include the interconnection efficiency, alignment precision and mechanical strength. The electrical properties comprise the leakage currents, tuning characteristics, charge collection, cluster sizes and hit efficiencies. Targeting at a usage at the high luminosity upgrade of the LHC accelerator called HL-LHC, the results were obtained before and after irradiation up to fluences of 10{sup 16}n{sub eq}/cm{sup 2}.

  7. K-edge imaging with the XPAD3 hybrid pixel detector, direct comparison of CdTe and Si sensors.

    Science.gov (United States)

    Cassol, F; Portal, L; Graber-Bolis, J; Perez-Ponce, H; Dupont, M; Kronland, C; Boursier, Y; Blanc, N; Bompard, F; Boudet, N; Buton, C; Clémens, J C; Dawiec, A; Debarbieux, F; Delpierre, P; Hustache, S; Vigeolas, E; Morel, C

    2015-07-21

    We investigate the improvement from the use of high-Z CdTe sensors for pre-clinical K-edge imaging with the hybrid pixel detectors XPAD3. We compare XPAD3 chips bump bonded to Si or CdTe sensors in identical experimental conditions. Image performance for narrow energy bin acquisitions and contrast-to-noise ratios of K-edge images are presented and compared. CdTe sensors achieve signal-to-noise ratios at least three times higher than Si sensors within narrow energy bins, thanks to their much higher detection efficiency. Nevertheless Si sensors provide better contrast-to-noise ratios in K-edge imaging when working at equivalent counting statistics, due to their better estimation of the attenuation coefficient of the contrast agent. Results are compared to simulated data in the case of the XPAD3/Si detector. Good agreement is observed when including charge sharing between pixels, which have a strong impact on contrast-to-noise ratios in K-edge images.

  8. A data parallel digitizer for a time-based simulation of CMOS Monolithic Active Pixel Sensors with FairRoot

    Science.gov (United States)

    Sitzmann, P.; Amar-Youcef, S.; Doering, D.; Deveaux, M.; Fröhlich, I.; Koziel, M.; Krebs, E.; Linnik, B.; Michel, J.; Milanovic, B.; Müntz, C.; Li, Q.; Stroth, J.; Tischler, T.

    2014-06-01

    CMOS Monolithic Active Pixel Sensors (MAPS) demonstrated excellent performances in the field of charged particle tracking. They feature an excellent single point resolution of few μm, a light material budget of 0.05% Xo in combination with a good radiation tolerance and time resolution. This makes the sensors a valuable technology for micro vertex detectors (MVD) of various experiments in heavy ion and particle physics like STAR and CBM. State of the art MAPS are equipped with a rolling shutter readout. Therefore, the data of one individual event is typically found in more than one data train generated by the sensor. This paper presents a concept to introduce this feature in both simulation and data analysis, taking profit of the sensor topology of the MVD. This topology allows to use for massive parallel data streaming and handling strategies within the FairRoot framework.

  9. Dynamic and thermodynamic mechanisms of TFA adsorption by particulate matter.

    Science.gov (United States)

    Guo, Junyu; Zhai, Zihan; Wang, Lei; Wang, Ziyuan; Wu, Jing; Zhang, Boya; Zhang, Jianbo

    2017-06-01

    Trifluoroacetic acid (TFA) in the atmosphere is produced by degradation of hydrochlorofluorocarbons and hydrofluorocarbons. In recent years, TFA has attracted global attention because of increased environmental concentrations, biological toxicity and accumulation in aqueous environments. This study focused on the mechanisms underlying the adsorption of TFA by particulate matter to identify the appropriate descriptive model for this process and thus improve estimation of TFA adsorption in future environmental monitoring. Onsite gas and particle phase sampling in Beijing, China, and subsequent measurement of TFA concentrations indicated that the TFA concentration in the gas phase (1396 ± 225 pg m(-3)) was much higher than that in the particle phase (62 ± 8 pg m(-3)) and that monthly concentrations varied seasonally with temperature. Based on the field results and analysis, an adsorption experiment of TFA on soot was then conducted at three different temperatures (293, 303, and 313 K) to provide parameters for kinetic and thermodynamic modelling. The proportion of atmospheric TFA concentration in the gas phase increased with temperature, indicating that temperature affected the phase distribution of TFA. The subsequent kinetic and thermodynamic modelling showed that the adsorption of TFA by soot could be described well by the Bangham kinetic model. The adsorption was controlled by diffusion, and the key mechanism was physical adsorption. The adsorption behavior can be well described by the Langmuir isotherm model. The calculated thermodynamic parameters ΔG° (-2.34, -1.25, and -0.15 kJ mol(-1) at 293, 303, and 313 K, respectively), ΔH° (-34.34 kJ mol(-1)), and ΔS° (-109.22 J mol(-1) K(-1)) for TFA adsorption by soot were negative, indicating that adsorption was a spontaneous, exothermic process. Copyright © 2017 Elsevier Ltd. All rights reserved.

  10. Characterization of CdTe sensors with Schottky contacts coupled to charge-integrating pixel array detectors for X-ray science

    Science.gov (United States)

    Becker, J.; Tate, M. W.; Shanks, K. S.; Philipp, H. T.; Weiss, J. T.; Purohit, P.; Chamberlain, D.; Ruff, J. P. C.; Gruner, S. M.

    2016-12-01

    Pixel Array Detectors (PADs) consist of an x-ray sensor layer bonded pixel-by-pixel to an underlying readout chip. This approach allows both the sensor and the custom pixel electronics to be tailored independently to best match the x-ray imaging requirements. Here we present characterizations of CdTe sensors hybridized with two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory. The charge-integrating architecture of each of these PADs extends the instantaneous counting rate by many orders of magnitude beyond that obtainable with photon counting architectures. The Keck PAD chip consists of rapid, 8-frame, in-pixel storage elements with framing periods detector, the MM-PAD, has an extended dynamic range by utilizing an in-pixel overflow counter coupled with charge removal circuitry activated at each overflow. This allows the recording of signals from the single-photon level to tens of millions of x-rays/pixel/frame while framing at 1 kHz. Both detector chips consist of a 128 × 128 pixel array with (150 μm)2 pixels.

  11. High-speed imaging at high x-ray energy: CdTe sensors coupled to charge-integrating pixel array detectors

    Energy Technology Data Exchange (ETDEWEB)

    Becker, Julian; Tate, Mark W.; Shanks, Katherine S.; Philipp, Hugh T.; Weiss, Joel T.; Purohit, Prafull [Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853 (United States); Chamberlain, Darol [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853 (United States); Gruner, Sol M., E-mail: smg26@cornell.edu [Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853 (United States); Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853 (United States)

    2016-07-27

    Pixel Array Detectors (PADs) consist of an x-ray sensor layer bonded pixel-by-pixel to an underlying readout chip. This approach allows both the sensor and the custom pixel electronics to be tailored independently to best match the x-ray imaging requirements. Here we describe the hybridization of CdTe sensors to two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory. The charge-integrating architecture of each of these PADs extends the instantaneous counting rate by many orders of magnitude beyond that obtainable with photon counting architectures. The Keck PAD chip consists of rapid, 8-frame, in-pixel storage elements with framing periods <150 ns. The second detector, the MM-PAD, has an extended dynamic range by utilizing an in-pixel overflow counter coupled with charge removal circuitry activated at each overflow. This allows the recording of signals from the single-photon level to tens of millions of x-rays/pixel/frame while framing at 1 kHz. Both detector chips consist of a 128×128 pixel array with (150 µm){sup 2} pixels.

  12. Modeling Inter-Pixel Crosstalk in Teledyne Imaging Sensors H4RG Detectors

    CERN Document Server

    Dudik, R P; Dorland, B N; Veillette, D; Waczynski, A; Lane, B; Loose, M; Kan, E; Waterman, J; Pravdo, S

    2012-01-01

    CMOS-hybrid arrays have recently surfaced as competitive optical detectors for use in ground- and space-based astronomy. One source of error in these detectors that does not appear in more traditional CCD arrays is the inter-pixel capacitance component of crosstalk. In this paper we use a single pixel reset method to model inter-pixel capacitance (IPC). We combine this IPC model with a model for charge diffusion to estimate the total crosstalk on H4RG arrays. Finally, we compare our model results to Fe55 data obtained using an astrometric camera built to test the H4RG-B0 generation detectors.

  13. Investigation of properties of novel silicon pixel assemblies employing thin n-in-p sensors and 3D-integration

    Energy Technology Data Exchange (ETDEWEB)

    Weigell, Philipp

    2013-01-15

    Until the end of the 2020 decade the LHC programme will be defining the high energy frontier of particle physics. During this time, three upgrade steps of the accelerator are currently planned to further increase the luminosity and energy reach. In the course of these upgrades the specifications of several parts of the current LHC detectors will be exceeded. Especially, the innermost tracking detectors are challenged by the increasing track densities and the radiation damage. This thesis focuses on the implications for the ATLAS experiment. Here, around 2021/2, after having collected an integrated luminosity of around 300 fb{sup -1}, the silicon and gas detector components of the inner tracker will reach the end of their lifetime and will need to be replaced to ensure sufficient performance for continued running - especially if the luminosity is raised to about 5 x 10{sup 35} cm{sup -2}s{sup -1} as currently planned. An all silicon inner detector is foreseen to be installed. This upgrade demands cost effective pixel assemblies with a minimal material budget, a larger active area fraction as compared to the current detectors, and a higher granularity. Furthermore, the assemblies must be able to withstand received fluences up to 2 . 10{sup 16} n{sub eq}/cm{sup 2}. A new pixel assembly concept answering the challenges posed by the high instantaneous luminosities is investigated in this thesis. It employs five novel technologies, namely n-in-p pixel sensors, thin pixel sensors, slim edges with or without implanted sensor sides, and 3D-integration incorporating a new interconnection technology, named Solid Liquid InterDiffusion (SLID) as well as Inter-Chip-Vias (ICVs). n-in-p sensors are cost-effective, since they only need patterned processing on one side. Their performance before and after irradiation is investigated and compared to results obtained with currently used n-in-n sensors. Reducing the thickness of the sensors lowers the amount of multiple scattering

  14. Investigation of charge-collection efficiency of Kyoto's X-ray astronomical SOI pixel sensors, XRPIX

    Energy Technology Data Exchange (ETDEWEB)

    Matsumura, Hideaki, E-mail: matumura@cr.scphys.kyoto-u.ac.jp [Department of Physics, Graduate School of Science, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto 606-8502 (Japan); Tsuru, Takeshi Go; Tanaka, Takaaki; Nakashima, Shinya; Ryu, Syukyo G. [Department of Physics, Graduate School of Science, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto 606-8502 (Japan); Takeda, Ayaki [Department of Particle and Nuclear Physics, Graduate School of High Energy Accelerator Science, The Graduate University for Advanced Studies (SOKENDAI), High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan); Arai, Yasuo; Miyoshi, Toshinobu [Institute of Particle and Nuclear Studies, High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801 (Japan)

    2014-11-21

    We are developing a monolithic active pixel sensor referred to as XRPIX for X-ray astronomy on the basis of silicon-on-insulator CMOS technology. A crucial issue in our recent development is the impact of incomplete charge collection on the spectroscopic performance. In this paper, we report the spectral responses of several devices having different intra-pixel structures or produced from different wafers. We found that an emission line spectrum exhibits large low-energy tails when the size of the buried p-well, which acts as the charge-collection node, is small. Moreover, in charge sharing events, the peak channels of the emission lines shift toward channels lower than those without charge sharing. This peak shift is more pronounced as the distance between the pixel center and the position of incident photon increases. This suggests that the charge-collection efficiency is degraded at the pixel boundary. We also found that the charge-collection efficiency depends on the strength of the electric field at the interface of the depletion and insulator layers.

  15. A Tracker for the Mu3e Experiment based on High-Voltage Monolithic Active Pixel Sensors

    CERN Document Server

    Berger, Niklaus; Bachmann, Sebastian; Kiehn, Moritz; Perić, Ivan; Perrevoort, Ann-Kathrin; Philipp, Raphael; Schöning, André; Stumpf, Kevin; Wiedner, Dirk; Windelband, Bernd; Zimmermann, Marco

    2013-01-01

    The Mu3e experiment searches for the lepton flavour violating decay mu+ -> e+e-e+, aiming for a branching fraction sensitivity of 10^-16. This requires an excellent momentum resolution for low energy electrons, high rate capability and a large acceptance. In order to minimize multiple scattering, the amount of material has to be as small as possible. These challenges can be met with a tracker built from high-voltage monolithic active pixel sensors (HV-MAPS), which can be thinned to 50 um and which incorporate the complete read-out electronics on the sensor chip. To further minimise material, the sensors are supported by a mechanical structure built from 25 um thick Kapton foil and cooled with gaseous helium.

  16. A tracker for the Mu3e experiment based on high-voltage monolithic active pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Berger, Niklaus, E-mail: nberger@physi.uni-heidelberg.de [Physikalisches Institut, Heidelberg University, Heidelberg (Germany); Augustin, Heiko; Bachmann, Sebastian; Kiehn, Moritz [Physikalisches Institut, Heidelberg University, Heidelberg (Germany); Perić, Ivan [Zentralinstitut für technische Informatik, Heidelberg University, Mannheim (Germany); Perrevoort, Ann-Kathrin; Philipp, Raphael; Schöning, André; Stumpf, Kevin; Wiedner, Dirk; Windelband, Bernd; Zimmermann, Marco [Physikalisches Institut, Heidelberg University, Heidelberg (Germany)

    2013-12-21

    The Mu3e experiment searches for the lepton flavour violating decay μ{sup +}→e{sup +}e{sup −}e{sup +}, aiming for a branching fraction sensitivity of 10{sup −16}. This requires an excellent momentum resolution for low energy electrons, high rate capability and a large acceptance. In order to minimise multiple scattering, the amount of material has to be as small as possible. These challenges can be met with a tracker built from high-voltage monolithic active pixel sensors (HV-MAPS), which can be thinned to 50μm and which incorporate the complete read-out electronics on the sensor chip. To further minimise material, the sensors are supported by a mechanical structure built from 25μm thick Kapton foil and cooled with gaseous helium.

  17. Imaging of moving fiducial markers during radiotherapy using a fast, efficient active pixel sensor based EPID

    Energy Technology Data Exchange (ETDEWEB)

    Osmond, John P. F.; Zin, Hafiz M.; Harris, Emma J.; Lupica, Giovanni; Allinson, Nigel M.; Evans, Philip M. [Joint Department of Physics, Institute of Cancer Research and The Royal Marsden NHS Foundation Trust, Downs Road, Sutton, Surrey, SM2 5PT (United Kingdom); Department of Electronic and Electrical Engineering, University of Sheffield, Mappin Street, Sheffield, S1 3JD (United Kingdom); Lincoln School of Computer Science, University of Lincoln, Brayford Pool, Lincoln, LN6 7TS (United Kingdom); Joint Department of Physics, Institute of Cancer Research and The Royal Marsden NHS Foundation Trust, Downs Road, Sutton, Surrey, SM2 5PT (United Kingdom)

    2011-11-15

    Purpose: The purpose of this work was to investigate the use of an experimental complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) for tracking of moving fiducial markers during radiotherapy. Methods: The APS has an active area of 5.4 x 5.4 cm and maximum full frame read-out rate of 20 frame s{sup -1}, with the option to read out a region-of-interest (ROI) at an increased rate. It was coupled to a 4 mm thick ZnWO4 scintillator which provided a quantum efficiency (QE) of 8% for a 6 MV x-ray treatment beam. The APS was compared with a standard iViewGT flat panel amorphous Silicon (a-Si) electronic portal imaging device (EPID), with a QE of 0.34% and a frame-rate of 2.5 frame s{sup -1}. To investigate the ability of the two systems to image markers, four gold cylinders of length 8 mm and diameter 0.8, 1.2, 1.6, and 2 mm were placed on a motion-platform. Images of the stationary markers were acquired using the APS at a frame-rate of 20 frame s{sup -1}, and a dose-rate of 143 MU min{sup -1} to avoid saturation. EPID images were acquired at the maximum frame-rate of 2.5 frame s{sup -1}, and a reduced dose-rate of 19 MU min{sup -1} to provide a similar dose per frame to the APS. Signal-to-noise ratio (SNR) of the background signal and contrast-to-noise ratio (CNR) of the marker signal relative to the background were evaluated for both imagers at doses of 0.125 to 2 MU. Results: Image quality and marker visibility was found to be greater in the APS with SNR {approx}5 times greater than in the EPID and CNR up to an order of magnitude greater for all four markers. To investigate the ability to image and track moving markers the motion-platform was moved to simulate a breathing cycle with period 6 s, amplitude 20 mm and maximum speed 13.2 mm s{sup -1}. At the minimum integration time of 50 ms a tracking algorithm applied to the APS data found all four markers with a success rate of {>=}92% and positional error {<=}90 {mu}m. At an integration time of 400

  18. A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling

    Science.gov (United States)

    Shafie, Suhaidi; Kawahito, Shoji; Itoh, Shinya

    2008-01-01

    A dynamic range expansion technique for CMOS image sensors with dual charge storage in a pixel and multiple sampling technique is presented. Each pixel contains a photodiode and a storage diode which is connected to the photodiode via a separation gate. The sensitivity of the signal charge in the storage diode can be controlled either by a separation gate which limits the charge to flow into the storage diode or by controlling the accumulation time in the storage diode. The operation of the sensitivity control with separation gate techniques is simulated and it is found that a blocking layer to the storage diode plays an important role for high controllability of sensitivity of the storage diode. A prototype chip for testing multiple short time accumulations is fabricated and measured. PMID:27879802

  19. A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling

    Directory of Open Access Journals (Sweden)

    Shinya Itoh

    2008-03-01

    Full Text Available A dynamic range expansion technique for CMOS image sensors with dual charge storage in a pixel and multiple sampling technique is presented. Each pixel contains a photodiode and a storage diode which is connected to the photodiode via a separation gate. The sensitivity of the signal charge in the storage diode can be controlled either by a separation gate which limits the charge to flow into the storage diode or by controlling the accumulation time in the storage diode. The operation of the sensitivity control with separation gate techniques is simulated and it is found that a blocking layer to the storage diode plays an important role for high controllability of sensitivity of the storage diode. A prototype chip for testing multiple short time accumulations is fabricated and measured.

  20. X-ray radiation damage studies and design of a silicon pixel sensor for science at the XFEL

    Energy Technology Data Exchange (ETDEWEB)

    Zhang, Jiaguo

    2013-06-15

    Experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors which can withstand X-ray doses up to 1 GGy. For the investigation of Xray radiation damage up to these high doses, MOS capacitors and gate-controlled diodes built on high resistivity n-doped silicon with crystal orientations left angle 100 right angle and left angle 111 right angle produced by four vendors, CiS, Hamamatsu, Canberra and Sintef have been irradiated with 12 keV X-rays at the DESY DORIS III synchrotron-light source. Using capacitance/ conductance-voltage, current-voltage and thermal dielectric relaxation current measurements, the densities of oxide charges and interface traps at the Si-SiO{sub 2} interface, and the surface-current densities have been determined as function of dose. Results indicate that the dose dependence of the oxide-charge density, the interface-trap density and the surface-current density depend on the crystal orientation and producer. In addition, the influence of the voltage applied to the gates of the MOS capacitor and the gate-controlled diode during X-ray irradiation on the oxide-charge density, the interface-trap density and the surface-current density has been investigated at doses of 100 kGy and 100 MGy. It is found that both strongly depend on the gate voltage if the electric field in the oxide points from the surface of the SiO{sub 2} to the Si-SiO{sub 2} interface. To verify the long-term stability of irradiated silicon sensors, annealing studies have been performed at 60 C and 80 C on MOS capacitors and gate-controlled diodes irradiated to 5 MGy as well, and the annealing kinetics of oxide charges and surface current were determined. Moreover, the macroscopic electrical properties of segmented sensors have slao been investigated as function of dose. It is found that the defects introduced by X-rays increase the full depletion voltage, the surface leakage current and the inter-electrode capacitance of the segmented sensor. An

  1. Tracking and flavour-tagging performance for HV-CMOS sensors in the context of the ATLAS ITK pixel simulation program

    Science.gov (United States)

    Calandri, A.; Vacavant, L.; Barbero, M.; Rozanov, A.; Djama, F.

    2016-12-01

    The HV-CMOS (High Voltage - Complementary Metal-Oxide Semiconductor) pixel technology has recently risen interest for the upgrade of the pixel detector of the ATLAS experiment towards the High Luminosity phase of the Large Hadron Collider (LHC) . HV-CMOS sensors can be employed in the pixel outer layers (R >15 cm), where the radiation hardness requirements are less stringent, as they could instrument large areas at a relatively low cost. In addition, smaller pixel granularity can be achieved by exploiting sub-pixel encoding technology. Therefore, the largest impact on physics performance, tracking and flavour tagging, could be reached if exploited in the innermost layer (in place of the current IBL) or in the next-to-innermost layer. This proceeding will present studies on tracking and flavour-tagging performance in presence of HV-CMOS sensors in the innermost layer of the ATLAS detector.

  2. The upgrade of the ALICE Inner Tracking System - Status of the R&D; on monolithic silicon pixel sensors

    CERN Document Server

    Van Hoorne, Jacobus Willem

    2014-01-01

    s a major part of its upgrade plans, the ALICE experiment schedules the installation of a novel Inner Tracking System (ITS) during the Long Shutdown 2 (LS2) of the LHC in 2018/19. It will replace the present silicon tracker with seven layers of Monolithic Active Pixel Sensors (MAPS) and significantly improve the detector performance in terms of tracking and rate capabilities. The choice of technology has been guided by the tight requirements on the material budget of 0 : 3 % X = X 0 /layer for the three innermost layers and backed by the significant progress in the field of MAPS in recent years. The pixel chips are manufactured in the TowerJazz 180 nm CMOS imaging sensor process on wafers with a high resistivity epitaxial layer. Within the ongoing R&D; phase, several sensor chip prototypes have been developed and produced on different epitaxial layer thicknesses and resistivities. These chips are being characterized for their performance before and after irradiation using source tests, test beam and measu...

  3. CMOS pixel sensor development for the ATLAS experiment at the High Luminosity-LHC

    CERN Document Server

    Rimoldi, Marco; The ATLAS collaboration

    2017-01-01

    The current ATLAS Inner Detector will be replaced with a fully silicon based detector called Inner Tracker (ITk) before the start of the High Luminosity-LHC project (HL-LHC) in 2026. To cope with the harsh environment expected at the HL-LHC, new approaches are being developed for pixel detector based on CMOS pixel techology. Such detectors provide charge collection, analog and digital amplification in the same silicon bulk. The radiation hardness is obtained with multiple nested wells that have embedded the CMOS electronics with sufficient shielding. The goal of this programme is to demonstrate that depleted CMOS pixels are suitable for high rate, fast timing and high radiation operation at the LHC. A number of alternative solutions have been explored and characterised, and are presented in this document.

  4. 3D silicon sensors: Design, large area production and quality assurance for the ATLAS IBL pixel detector upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Da Via, Cinzia [School of Physics and Astronomy, University of Manchester, Oxford Road, Manchester, M13 9PL (United Kingdom); Boscardin, Maurizio [Fondazione Bruno Kessler, FBK-CMM, Via Sommarive 18, I-38123 Trento (Italy); Dalla Betta, Gian-Franco, E-mail: dallabe@disi.unitn.it [DISI, Universita degli Studi di Trento and INFN, Via Sommarive 14, I-38123 Trento (Italy); Darbo, Giovanni [INFN Sezione di Genova, Via Dodecaneso 33, I-14146 Genova (Italy); Fleta, Celeste [Centro Nacional de Microelectronica, CNM-IMB (CSIC), Barcelona E-08193 (Spain); Gemme, Claudia [INFN Sezione di Genova, Via Dodecaneso 33, I-14146 Genova (Italy); Grenier, Philippe [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025 (United States); Grinstein, Sebastian [Institut de Fisica d' Altes Energies (IFAE) and ICREA, Universitat Autonoma de Barcelona (UAB), E-08193 Bellaterra, Barcelona (Spain); Hansen, Thor-Erik [SINTEF MiNaLab, Blindern, N-0314 Oslo (Norway); Hasi, Jasmine; Kenney, Chris [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025 (United States); Kok, Angela [SINTEF MiNaLab, Blindern, N-0314 Oslo (Norway); Parker, Sherwood [University of Hawaii, c/o Lawrence Berkeley Laboratory, Berkeley, CA 94720 (United States); Pellegrini, Giulio [Centro Nacional de Microelectronica, CNM-IMB (CSIC), Barcelona E-08193 (Spain); Vianello, Elisa; Zorzi, Nicola [Fondazione Bruno Kessler, FBK-CMM, Via Sommarive 18, I-38123 Trento (Italy)

    2012-12-01

    3D silicon sensors, where electrodes penetrate the silicon substrate fully or partially, have successfully been fabricated in different processing facilities in Europe and USA. The key to 3D fabrication is the use of plasma micro-machining to etch narrow deep vertical openings allowing dopants to be diffused in and form electrodes of pin junctions. Similar openings can be used at the sensor's edge to reduce the perimeter's dead volume to as low as {approx}4 {mu}m. Since 2009 four industrial partners of the 3D ATLAS R and D Collaboration started a joint effort aimed at one common design and compatible processing strategy for the production of 3D sensors for the LHC Upgrade and in particular for the ATLAS pixel Insertable B-Layer (IBL). In this project, aimed for installation in 2013, a new layer will be inserted as close as 3.4 cm from the proton beams inside the existing pixel layers of the ATLAS experiment. The detector proximity to the interaction point will therefore require new radiation hard technologies for both sensors and front end electronics. The latter, called FE-I4, is processed at IBM and is the biggest front end of this kind ever designed with a surface of {approx}4 cm{sup 2}. The performance of 3D devices from several wafers was evaluated before and after bump-bonding. Key design aspects, device fabrication plans and quality assurance tests during the 3D sensors prototyping phase are discussed in this paper.

  5. An introduction to monolithic active pixel sensors%单片式有源像素探测器简介

    Institute of Scientific and Technical Information of China (English)

    王萌

    2011-01-01

    A monolithic active pixel sensor (MAPS) is based on very large scale integration CMOS technology. Its working principle, prototypes, improvements and development trends are introduced in the article.%介绍了基于CMOS超大规模集成电路工艺的单片式有源像素探测器(MAPS),包括它的工作原理、特型、以及一些改进方案与发展的趋势。

  6. Reduction of cross-talks between circuit and sensor layer in the Kyoto's X-ray astronomy SOI pixel sensors with Double-SOI wafer

    Science.gov (United States)

    Ohmura, Shunichi; Tsuru, Takeshi Go; Tanaka, Takaaki; Uchida, Hiroyuki; Takeda, Ayaki; Matsumura, Hideaki; Ito, Makoto; Arai, Yasuo; Kurachi, Ikuo; Miyoshi, Toshinobu; Nakashima, Shinya; Mori, Koji; Nishioka, Yusuke; Takebayashi, Nobuaki; Noda, Koki; Kohmura, Takayoshi; Tamasawa, Kouki; Ozawa, Yusuke; Sato, Tadashi; Konno, Takahiro; Kawahito, Shoji; Kagawa, Keiichiro; Yasutomi, Keita; Kamehama, Hiroki; Shrestha, Sumeet; Hara, Kazuhiko; Honda, Shunsuke

    2016-09-01

    We have been developing silicon-on-insulator pixel sensors, "XRPIXs," for future X-ray astronomy satellites. XRPIXs are equipped with a function of "event-driven readout," with which we can read out only hit pixels by trigger signals and hence realize good time resolution reaching ∼ 10 μs . The current version of XRPIX suffers from a problem that the spectral performance degrades in the event-driven readout mode compared to the frame-readout mode, in which all the pixels are read out serially. Previous studies have clarified that one of the causes is capacitive coupling between the sense node and the trigger signal line in the circuit layer. In order to solve the problem, we adopt the Double SOI structure having a middle silicon layer between the circuit and the sensor layers. We expect the middle silicon layer to work as an electrostatic shield and reduces the capacitive coupling. In this paper, we report the spectroscopic performance of XRPIX with the middle silicon layer. We successfully reduce the capacitive coupling and the readout noise.

  7. Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations

    CERN Document Server

    Schwandt, J; Klanner, R; Pintilie, I; Zhang, J

    2011-01-01

    The European X-ray Free Electron Laser (XFEL) will deliver 27000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the recording of diffraction patterns of single molecules and the study of ultra-fast processes. One of the detector systems under development for the XFEL is the Adaptive Gain Integrating Pixel Detector (AGIPD), which consists of a pixel array with readout ASICs bump-bonded to a silicon sensor with pixels of 200 {\\mu}m \\times 200 {\\mu}m. The particular requirements for the detector are a high dynamic range (0, 1 up to 10E5 12 keV photons/XFEL-pulse), a fast read-out and radiation tolerance up to doses of 1 GGy of 12 keV X-rays for 3 years of operation. At this X-ray energy no bulk damage in silicon is expected. However fixed oxide charges in the SiO2 layer and interface traps at the Si-SiO2 interface will build up. As function of the 12 keV X-ray dose the microscopic defects in test structures and the macro- scopic electrical properties of...

  8. Efficiency enhancement in a backside illuminated 1.12 μm pixel CMOS image sensor via parabolic color filters.

    Science.gov (United States)

    Lee, Jong-Kwon; Kim, Ahreum; Kang, Dong-Wan; Lee, Byung Yang

    2016-07-11

    The shrinkage of pixel size down to sub-2 μm in high-resolution CMOS image sensors (CISs) results in degraded efficiency and increased crosstalk. The backside illumination technology can increase the efficiency, but the crosstalk still remains an critical issue to improve the image quality of the CIS devices. In this paper, by adopting a parabolic color filter (P-CF), we demonstrate efficiency enhancement without any noticeable change in optical crosstalk of a backside illuminated 1.12 μm pixel CIS with deep-trench-isolation structure. To identify the observed results, we have investigated the effect of radius of curvature (r) of the P-CF on the efficiency and optical crosstalk of the CIS by performing an electromagnetic analysis. As the r of P-CF becomes equal to (or half) that of the microlens, the efficiencies of the B-, G-, and R-pixels increase by a factor of 14.1% (20.3%), 9.8% (15.3%), and 15.0% (15.7%) with respect to the flat CF cases without any noticeable crosstalk change. Also, as the incident angle increases up to 30°, the angular dependence of the efficiency and crosstalk significantly decreases by utilizing the P-CF in the CIS. Meanwhile, further reduction of r severely increases the optical crosstalk due to the increased diffraction effect, which has been confirmed with the simulated electric-field intensity distribution inside the devices.

  9. Development of Edgeless Silicon Pixel Sensors on p-type substrate for the ATLAS High-Luminosity Upgrade

    CERN Document Server

    Calderini, G; Bomben, M; Boscardin, M; Bosisio, L; Chauveau, J; Giacomini, G; La Rosa, A; Marchiori, G; Zorzi, N

    2014-01-01

    In view of the LHC upgrade for the high luminosity phase (HL-LHC), the ATLAS experiment is planning to replace the inner detector with an all-silicon system. The n-in-p bulk technology represents a valid solution for the modules of most of the layers, given the significant radiation hardness of this option and the reduced cost. The large area necessary to instrument the outer layers will demand to tile the sensors, a solution for which the inefficient region at the border of each sensor needs to be reduced to the minimum size. This paper reports on a joint R&D project by the ATLAS LPNHE Paris group and FBK Trento on a novel n-in-p edgeless planar pixel design, based on the deep-trench process available at FBK.

  10. Low-power priority Address-Encoder and Reset-Decoder data-driven readout for Monolithic Active Pixel Sensors for tracker system

    Energy Technology Data Exchange (ETDEWEB)

    Yang, P., E-mail: yangping0710@126.com [Central China Normal University, Wuhan (China); Aglieri, G.; Cavicchioli, C. [CERN, 1210 Geneva 23 (Switzerland); Chalmet, P.L. [MIND, Archamps (France); Chanlek, N. [Suranaree University of Technology, Nakhon Ratchasima (Thailand); Collu, A. [University of Cagliari, Cagliari (Italy); INFN (Italy); Gao, C. [Central China Normal University, Wuhan (China); Hillemanns, H.; Junique, A. [CERN, 1210 Geneva 23 (Switzerland); Kofarago, M. [CERN, 1210 Geneva 23 (Switzerland); University of Utrecht, Utrecht (Netherlands); Keil, M.; Kugathasan, T. [CERN, 1210 Geneva 23 (Switzerland); Kim, D. [Dongguk and Yonsei University, Seoul (Korea, Republic of); Kim, J. [Pusan National University, Busan (Korea, Republic of); Lattuca, A. [University of Torino, Torino (Italy); INFN (Italy); Marin Tobon, C.A. [CERN, 1210 Geneva 23 (Switzerland); Marras, D. [University of Cagliari, Cagliari (Italy); INFN (Italy); Mager, M.; Martinengo, P. [CERN, 1210 Geneva 23 (Switzerland); Mazza, G. [University of Torino, Torino (Italy); INFN (Italy); and others

    2015-06-11

    Active Pixel Sensors used in High Energy Particle Physics require low power consumption to reduce the detector material budget, low integration time to reduce the possibilities of pile-up and fast readout to improve the detector data capability. To satisfy these requirements, a novel Address-Encoder and Reset-Decoder (AERD) asynchronous circuit for a fast readout of a pixel matrix has been developed. The AERD data-driven readout architecture operates the address encoding and reset decoding based on an arbitration tree, and allows us to readout only the hit pixels. Compared to the traditional readout structure of the rolling shutter scheme in Monolithic Active Pixel Sensors (MAPS), AERD can achieve a low readout time and a low power consumption especially for low hit occupancies. The readout is controlled at the chip periphery with a signal synchronous with the clock, allows a good digital and analogue signal separation in the matrix and a reduction of the power consumption. The AERD circuit has been implemented in the TowerJazz 180 nm CMOS Imaging Sensor (CIS) process with full complementary CMOS logic in the pixel. It works at 10 MHz with a matrix height of 15 mm. The energy consumed to read out one pixel is around 72 pJ. A scheme to boost the readout speed to 40 MHz is also discussed. The sensor chip equipped with AERD has been produced and characterised. Test results including electrical beam measurement are presented.

  11. A Design of a New Column-Parallel Analog-to-Digital Converter Flash for Monolithic Active Pixel Sensor.

    Science.gov (United States)

    Chakir, Mostafa; Akhamal, Hicham; Qjidaa, Hassan

    2017-01-01

    The CMOS Monolithic Active Pixel Sensor (MAPS) for the International Linear Collider (ILC) vertex detector (VXD) expresses stringent requirements on their analog readout electronics, specifically on the analog-to-digital converter (ADC). This paper concerns designing and optimizing a new architecture of a low power, high speed, and small-area 4-bit column-parallel ADC Flash. Later in this study, we propose to interpose an S/H block in the converter. This integration of S/H block increases the sensitiveness of the converter to the very small amplitude of the input signal from the sensor and provides a sufficient time to the converter to be able to code the input signal. This ADC is developed in 0.18 μm CMOS process with a pixel pitch of 35 μm. The proposed ADC responds to the constraints of power dissipation, size, and speed for the MAPS composed of a matrix of 64 rows and 48 columns where each column ADC covers a small area of 35 × 336.76 μm(2). The proposed ADC consumes low power at a 1.8 V supply and 100 MS/s sampling rate with dynamic range of 125 mV. Its DNL and INL are 0.0812/-0.0787 LSB and 0.0811/-0.0787 LSB, respectively. Furthermore, this ADC achieves a high speed more than 5 GHz.

  12. Characterization of CdTe Sensors with Schottky Contacts Coupled to Charge-Integrating Pixel Array Detectors for X-Ray Science

    CERN Document Server

    Becker, Julian; Shanks, Katherine S; Philipp, Hugh T; Weiss, Joel T; Purohit, Prafull; Chamberlain, Darol; Ruff, Jacob P C; Gruner, Sol M

    2016-01-01

    Pixel Array Detectors (PADs) consist of an x-ray sensor layer bonded pixel-by-pixel to an underlying readout chip. This approach allows both the sensor and the custom pixel electronics to be tailored independently to best match the x-ray imaging requirements. Here we present characterizations of CdTe sensors hybridized with two different charge-integrating readout chips, the Keck PAD and the Mixed-Mode PAD (MM-PAD), both developed previously in our laboratory. The charge-integrating architecture of each of these PADs extends the instantaneous counting rate by many orders of magnitude beyond that obtainable with photon counting architectures. The Keck PAD chip consists of rapid, 8-frame, in-pixel storage elements with framing periods $<$150 ns. The second detector, the MM-PAD, has an extended dynamic range by utilizing an in-pixel overflow counter coupled with charge removal circuitry activated at each overflow. This allows the recording of signals from the single-photon level to tens of millions of x-rays/...

  13. Cultivating Political Powerhouses: TFA Corps Members Experiences That Shape Local Political Engagement

    Science.gov (United States)

    Jacobsen, Rebecca; White, Rachel; Reckhow, Sarah

    2016-01-01

    In recent years, Teach for America (TFA) has invested in developing corps members as leaders. Although TFA asks corps members for a two-year commitment, TFA celebrates the achievements of alumni who have gone on to careers in politics, public policy, and advocacy. Thus, many community leaders see the arrival of TFA corps members as having a…

  14. A novel position and time sensing active pixel sensor with field-assisted electron collection for charged particle tracking and electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    De Geronimo, G. [Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973-5000 (United States); Deptuch, G. [Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973-5000 (United States); Dragone, A. [Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973-5000 (United States); Radeka, V. [Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973-5000 (United States); Rehak, P. [Brookhaven National Laboratory, Instrumentation Division, Upton, NY 11973-5000 (United States)]. E-mail: rehak@bnl.gov; Castoldi, A. [Politecnico di Milano, Dip. Ingegneria Nucleare, 20133 Milan (Italy); INFN Sez. Milano, 20133 Milan (Italy); Fazzi, A. [Politecnico di Milano, Dip. Ingegneria Nucleare, 20133 Milan (Italy); INFN Sez. Milano, 20133 Milan (Italy); Gatti, E. [Politecnico di Milano, Dip. Elettronica e Informazione, 20133 Milan (Italy); INFN Sez. Milano, 20133 Milan (Italy); Guazzoni, C. [Politecnico di Milano, Dip. Elettronica e Informazione, 20133 Milan (Italy); INFN Sez. Milano, 20133 Milan (Italy); Rijssenbeek, M. [Physics Department of State University of New York at Stony Brook, NY 11790 (United States); Dulinski, W. [Institut de Recherches Subatomiques, 23 rue du Loess BP 28, 67037 Strasbourg cedex (France); Besson, A. [Institut de Recherches Subatomiques, 23 rue du Loess BP 28, 67037 Strasbourg cedex (France); Deveaux, M. [Institut de Recherches Subatomiques, 23 rue du Loess BP 28, 67037 Strasbourg cedex (France); Winter, M. [Institut de Recherches Subatomiques, 23 rue du Loess BP 28, 67037 Strasbourg cedex (France)

    2006-11-30

    A new type of active pixel sensors (APSs) to track charged particles for particle physics experiments or to count number of electrons that cross any pixel at the focal plane of electron microscopes is described. The electric field of desirable shape is created inside the active volume of the pixel introducing the drift component in the movement of the signal electrons towards charge collecting electrodes. The electric field results from the flow of {approx}100 mA/cm{sup 2} hole currents within individual pixels of the sensor. The proposed sensor is produced using a standard industrially available complementary metal oxide silicon (CMOS) process. There are two main advantages of the proposed detectors when compared to the present (February 2005) state-of-the-art, i.e. field-free APS sensors. The first advantage of a field-assisted transport mechanism is the reduction of the charge collection time and of the sharing of the signal electrons between adjacent pixels by diffusion. The second advantage is the freedom to use both kinds of MOS transistors within each pixel of the sensor. Thus, the full functional power of CMOS circuits can be embedded in situ. As an example, 16-bit scalers will be implemented in each pixel of the sensor for electron microscopy. The reduced collection time combined with the state-of-the-art electronics within each pixel provides the most complete information about the position and the timing of incident charged particles for particle physics experiments. Position resolution of new sensors was computationally simulated to be a few microns, that is, the same as the resolution of standard APSs. Moreover, the active depth of the sensor and the associate electronics is less than about 20 {mu}m and a thinned down sensor together with its beryllium backing can have a total thickness of less than 0.1% of one radiation length. The reduction of the thickness of the detector reduces the amount of multiple scattering within the detector. The

  15. Radiation-hard Active Pixel Sensors for HL-LHC Detector Upgrades based on HV-CMOS Technology

    CERN Document Server

    Miucci, A; Hemperek, T.; Hügging, F.; Krüger, H.; Obermann, T.; Wermes, N.; Garcia-Sciveres, M.; Backhaus, M.; Capeans, M.; Feigl, S.; Nessi, M.; Pernegger, H.; Ristic, B.; Gonzalez-Sevilla, S.; Ferrere, D.; Iacobucci, G.; Rosa, A.La; Muenstermann, D.; George, M.; Grosse-Knetter, J.; Quadt, A.; Rieger, J.; Weingarten, J.; Bates, R.; Blue, A.; Buttar, C.; Hynds, D.; Kreidl, C.; Peric, I.; Breugnon, P.; Pangaud, P.; Godiot-Basolo, S.; Fougeron, D.; Bompard, F.; Clemens, J.C.; Liu, J; Barbero, M.; Rozanov, A

    2014-01-01

    Luminosity upgrades are discussed for the LHC (HL-LHC) which would make updates to the detectors necessary, requiring in particular new, even more radiation-hard and granular, sensors for the inner detector region. 1Corresponding author. c CERN 2014, published under the terms of the Creative Commons Attribution 3.0 License by IOP Publishing Ltd and Sissa Medialab srl. Any further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation and DOI. doi:10.1088/1748-0221/9/05/C050642014 JINST 9 C05064 A proposal for the next generation of inner detectors is based on HV-CMOS: a new family of silicon sensors based on commercial high-voltage CMOS technology, which enables the fabrication of part of the pixel electronics inside the silicon substrate itself. The main advantages of this technology with respect to the standard silicon sensor technology are: low material budget, fast charge collection time, high radiation tolerance, low cost and operation a...

  16. Performance of the reconstruction algorithms of the FIRST experiment pixel sensors vertex detector

    CERN Document Server

    Rescigno, R; Juliani, D; Spiriti, E; Baudot, J; Abou-Haidar, Z; Agodi, C; Alvarez, M A G; Aumann, T; Battistoni, G; Bocci, A; Böhlen, T T; Boudard, A; Brunetti, A; Carpinelli, M; Cirrone, G A P; Cortes-Giraldo, M A; Cuttone, G; De Napoli, M; Durante, M; Gallardo, M I; Golosio, B; Iarocci, E; Iazzi, F; Ickert, G; Introzzi, R; Krimmer, J; Kurz, N; Labalme, M; Leifels, Y; Le Fevre, A; Leray, S; Marchetto, F; Monaco, V; Morone, M C; Oliva, P; Paoloni, A; Patera, V; Piersanti, L; Pleskac, R; Quesada, J M; Randazzo, N; Romano, F; Rossi, D; Rousseau, M; Sacchi, R; Sala, P; Sarti, A; Scheidenberger, C; Schuy, C; Sciubba, A; Sfienti, C; Simon, H; Sipala, V; Tropea, S; Vanstalle, M; Younis, H

    2014-01-01

    Hadrontherapy treatments use charged particles (e.g. protons and carbon ions) to treat tumors. During a therapeutic treatment with carbon ions, the beam undergoes nuclear fragmentation processes giving rise to significant yields of secondary charged particles. An accurate prediction of these production rates is necessary to estimate precisely the dose deposited into the tumours and the surrounding healthy tissues. Nowadays, a limited set of double differential carbon fragmentation cross-section is available. Experimental data are necessary to benchmark Monte Carlo simulations for their use in hadrontherapy. The purpose of the FIRST experiment is to study nuclear fragmentation processes of ions with kinetic energy in the range from 100 to 1000 MeV/u. Tracks are reconstructed using information from a pixel silicon detector based on the CMOS technology. The performances achieved using this device for hadrontherapy purpose are discussed. For each reconstruction step (clustering, tracking and vertexing), different...

  17. Characterisation of Irradiated Thin Silicon Sensors for the CMS Phase II Pixel Upgrade

    CERN Document Server

    Centis Vignali, Matteo; Eichhorn, Thomas; Garutti, Erika; Junkes, Alexandra; Steinbrueck, Georg; bigskip; Institut fur Experimentalphysik; Luruper Chaussee; Hamburg; Deutsches Elektronen-Synchrotron Notkestra; e; Hamburg

    2016-01-01

    In this paper, the results obtained from the characterisation of 100 and 200\\,$\\mu$m thick p-bulk pad diodes and strip sensors irradiated up to fluences of $\\Phi_{eq} = 1.3 \\times 10^{16}$ cm$^{-2}$ are shown.

  18. TFA Tanks Focus Area midyear review report FY 2000

    Energy Technology Data Exchange (ETDEWEB)

    LR Roeder-Smith

    2000-05-02

    In accordance with EM's office of Science and Technology (OST), the TFA is committed to assessing the maturity of technology development projects and ensuring their readiness for implementation and subsequent deployment. The TFA conducts an annual Midyear Review to document the status of ongoing projects, reaffirm and document user commitment to selected projects, and to improve the effective deployment of technology by determining and documenting the readiness of selected projects to move ahead. Since 1995, OST has used a linear technology maturation model that spans through seven defined stages of maturity, from basic research to implementation. Application of this Stage/Gate model to technology development resulted in prescriptive and somewhat cumbersome review procedures, resulting in limited and inconsistent use. Subsequently, in February 2000, OST issued revised guidance in an effort to streamline the technology tracking and review process. While the new OST guidance reinforces peer review requirements and the use of the American Society of Mechanical Engineers (ASME) for independent reviews, it also implements a simplified Gate model. The TFA is now responsible for providing auditable documentation for passing only three stages of technology maturity: ready for research (Gate 0); ready for development (Gate 2); ready for demonstration (Gate 5). The TFA Midyear Review is a key element in the overall review procedure, as the tracking evidence for all active projects is required to be available at this time. While the Midyear Report contains an overview of the status of all TFA reviews and projects, not all the reviews were conducted during the Midyear Review. The TFA used a phased approach to accomplish the Midyear Review requirements.

  19. Protein Impregnated Polymer (PIP) Film Infrared Sensor Using Suspended Microelectromechanical Systems (MEMS) Pixels

    Science.gov (United States)

    2005-09-01

    Sensor (a) without PIP material and (b) with PIP material applied by spin coating at 5000 rpm for 30 seconds. .............. 80 Figure 42...82 Figure 45. Common problems and anomalies caused by PIP spin coating process. ........ 83 xi Figure 46. SEM image of...applied first by LPCVD [6]. Then, photoresist is applied by spin coating a liquid photoresist onto the wafer and then baking the wafer at a raised

  20. The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors

    Directory of Open Access Journals (Sweden)

    Gerhard Lutz

    2016-04-01

    Full Text Available Depleted field effect transistors (DEPFET are used to achieve very low noise signal charge readout with sub-electron measurement precision. This is accomplished by repeatedly reading an identical charge, thereby suppressing not only the white serial noise but also the usually constant 1/f noise. The repetitive non-destructive readout (RNDR DEPFET is an ideal central element for an active pixel sensor (APS pixel. The theory has been derived thoroughly and results have been verified on RNDR-DEPFET prototypes. A charge measurement precision of 0.18 electrons has been achieved. The device is well-suited for spectroscopic X-ray imaging and for optical photon counting in pixel sensors, even at high photon numbers in the same cell.

  1. Development of CMOS Monolithic Active Pixel Sensors for the ALICE-ITS Outer Barrel and for the CBM-MVD

    CERN Document Server

    Deveaux, Michael

    2015-01-01

    After more than a decade of R&D;, CMOS Monolithic Active Pixel Sensors (MAPS or CPS) have proven to offer concrete answers to the demanding requirements of subatomic physics experi- ments. Their main advantages result from their low material budget, their very high granularity and their integrated signal processing circuitry, which allows coping with high particle rates. Moreover, they offer a valuable radiation tolerance and may be produced at low cost. Sensors of the MIMOSA series have offered an opportunity for nuclear and particle physics exper- iments to address with improved sensitivity physics studies requiring an accurate reconstruction of short living and soft particles. One of their major applications is the STAR-PXL detector, which is the first vertex detector based on MAPS. While this experiment is successfully taking data since two years, it was found that the 0.35 m CMOS technology used for this purpose is not suited for upcoming applications like the CBM micro-vertex detector (MVD) and the ...

  2. X-ray Performance of Back-Side Illuminated Type of Kyoto's X-ray Astronomical SOI Pixel Sensor, XRPIX

    CERN Document Server

    Itou, Makoto; Tanaka, Takaaki; Takeda, Ayaki; Matsumura, Hideaki; Ohmura, Shunichi; Nakashima, Shinya; Arai, Yasuo; Mori, Koji; Takenaka, Ryota; Nishioka, Yusuke; Kohmura, Takayoshi; Tamasawa, Koki; Tindall, Craig

    2016-01-01

    We have been developing X-ray SOI pixel Sensors, called "XRPIX", for future X-ray astronomy satellites that enable us to observe in the wide energy band of 0.5-40 keV. Since XRPIXs have the circuitry layer with a thickness of about 8 {\\mu}m in the front side of the sensor, it is impossible to detect low energy X-rays with a front-illuminated type. So, we have been developing back-illuminated type of XRPIX with a less 1 {\\mu}m dead layer in the back-side, which enables the sensitivity to reach 0.5 keV. We produced two types of back-side illuminated (BI) XRPIXs, one of which is produced in "Pizza process" which LBNL developed and the other is processed in the ion implantation and laser annealing. We irradiated both of the BI-XRPIXs with soft X-ray and investigate soft X-ray performance of them. We report results from soft X-ray evaluation test of the device.

  3. Performance of the reconstruction algorithms of the FIRST experiment pixel sensors vertex detector

    Energy Technology Data Exchange (ETDEWEB)

    Rescigno, R., E-mail: regina.rescigno@iphc.cnrs.fr [Institut Pluridisciplinaire Hubert Curien, 23 rue du Loess, 67037 Strasbourg Cedex 2 (France); Finck, Ch.; Juliani, D. [Institut Pluridisciplinaire Hubert Curien, 23 rue du Loess, 67037 Strasbourg Cedex 2 (France); Spiriti, E. [Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali di Frascati (Italy); Istituto Nazionale di Fisica Nucleare - Sezione di Roma 3 (Italy); Baudot, J. [Institut Pluridisciplinaire Hubert Curien, 23 rue du Loess, 67037 Strasbourg Cedex 2 (France); Abou-Haidar, Z. [CNA, Sevilla (Spain); Agodi, C. [Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud (Italy); Alvarez, M.A.G. [CNA, Sevilla (Spain); Aumann, T. [GSI Helmholtzzentrum für Schwerionenforschung, Darmstadt (Germany); Battistoni, G. [Istituto Nazionale di Fisica Nucleare - Sezione di Milano (Italy); Bocci, A. [CNA, Sevilla (Spain); Böhlen, T.T. [European Organization for Nuclear Research CERN, Geneva (Switzerland); Medical Radiation Physics, Karolinska Institutet and Stockholm University, Stockholm (Sweden); Boudard, A. [CEA-Saclay, IRFU/SPhN, Gif sur Yvette Cedex (France); Brunetti, A.; Carpinelli, M. [Istituto Nazionale di Fisica Nucleare - Sezione di Cagliari (Italy); Università di Sassari (Italy); Cirrone, G.A.P. [Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud (Italy); Cortes-Giraldo, M.A. [Departamento de Fisica Atomica, Molecular y Nuclear, University of Sevilla, 41080-Sevilla (Spain); Cuttone, G.; De Napoli, M. [Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud (Italy); Durante, M. [GSI Helmholtzzentrum für Schwerionenforschung, Darmstadt (Germany); and others

    2014-12-11

    Hadrontherapy treatments use charged particles (e.g. protons and carbon ions) to treat tumors. During a therapeutic treatment with carbon ions, the beam undergoes nuclear fragmentation processes giving rise to significant yields of secondary charged particles. An accurate prediction of these production rates is necessary to estimate precisely the dose deposited into the tumours and the surrounding healthy tissues. Nowadays, a limited set of double differential carbon fragmentation cross-section is available. Experimental data are necessary to benchmark Monte Carlo simulations for their use in hadrontherapy. The purpose of the FIRST experiment is to study nuclear fragmentation processes of ions with kinetic energy in the range from 100 to 1000 MeV/u. Tracks are reconstructed using information from a pixel silicon detector based on the CMOS technology. The performances achieved using this device for hadrontherapy purpose are discussed. For each reconstruction step (clustering, tracking and vertexing), different methods are implemented. The algorithm performances and the accuracy on reconstructed observables are evaluated on the basis of simulated and experimental data.

  4. Performance of the reconstruction algorithms of the FIRST experiment pixel sensors vertex detector

    Science.gov (United States)

    Rescigno, R.; Finck, Ch.; Juliani, D.; Spiriti, E.; Baudot, J.; Abou-Haidar, Z.; Agodi, C.; Alvarez, M. A. G.; Aumann, T.; Battistoni, G.; Bocci, A.; Böhlen, T. T.; Boudard, A.; Brunetti, A.; Carpinelli, M.; Cirrone, G. A. P.; Cortes-Giraldo, M. A.; Cuttone, G.; De Napoli, M.; Durante, M.; Gallardo, M. I.; Golosio, B.; Iarocci, E.; Iazzi, F.; Ickert, G.; Introzzi, R.; Krimmer, J.; Kurz, N.; Labalme, M.; Leifels, Y.; Le Fevre, A.; Leray, S.; Marchetto, F.; Monaco, V.; Morone, M. C.; Oliva, P.; Paoloni, A.; Patera, V.; Piersanti, L.; Pleskac, R.; Quesada, J. M.; Randazzo, N.; Romano, F.; Rossi, D.; Rousseau, M.; Sacchi, R.; Sala, P.; Sarti, A.; Scheidenberger, C.; Schuy, C.; Sciubba, A.; Sfienti, C.; Simon, H.; Sipala, V.; Tropea, S.; Vanstalle, M.; Younis, H.

    2014-12-01

    Hadrontherapy treatments use charged particles (e.g. protons and carbon ions) to treat tumors. During a therapeutic treatment with carbon ions, the beam undergoes nuclear fragmentation processes giving rise to significant yields of secondary charged particles. An accurate prediction of these production rates is necessary to estimate precisely the dose deposited into the tumours and the surrounding healthy tissues. Nowadays, a limited set of double differential carbon fragmentation cross-section is available. Experimental data are necessary to benchmark Monte Carlo simulations for their use in hadrontherapy. The purpose of the FIRST experiment is to study nuclear fragmentation processes of ions with kinetic energy in the range from 100 to 1000 MeV/u. Tracks are reconstructed using information from a pixel silicon detector based on the CMOS technology. The performances achieved using this device for hadrontherapy purpose are discussed. For each reconstruction step (clustering, tracking and vertexing), different methods are implemented. The algorithm performances and the accuracy on reconstructed observables are evaluated on the basis of simulated and experimental data.

  5. Optimized sampling strategy of Wireless sensor network for validation of remote sensing products over heterogeneous coarse-resolution pixel

    Science.gov (United States)

    Peng, J.; Liu, Q.; Wen, J.; Fan, W.; Dou, B.

    2015-12-01

    Coarse-resolution satellite albedo products are increasingly applied in geographical researches because of their capability to characterize the spatio-temporal patterns of land surface parameters. In the long-term validation of coarse-resolution satellite products with ground measurements, the scale effect, i.e., the mismatch between point measurement and pixel observation becomes the main challenge, particularly over heterogeneous land surfaces. Recent advances in Wireless Sensor Networks (WSN) technologies offer an opportunity for validation using multi-point observations instead of single-point observation. The difficulty is to ensure the representativeness of the WSN in heterogeneous areas with limited nodes. In this study, the objective is to develop a ground-based spatial sampling strategy through consideration of the historical prior knowledge and avoidance of the information redundancy between different sensor nodes. Taking albedo as an example. First, we derive monthly local maps of albedo from 30-m HJ CCD images a 3-year period. Second, we pick out candidate points from the areas with higher temporal stability which helps to avoid the transition or boundary areas. Then, the representativeness (r) of each candidate point is evaluated through the correlational analysis between the point-specific and area-average time sequence albedo vector. The point with the highest r was noted as the new sensor point. Before electing a new point, the vector component of the selected points should be taken out from the vectors in the following correlational analysis. The selection procedure would be ceased once if the integral representativeness (R) meets the accuracy requirement. Here, the sampling method is adapted to both single-parameter and multi-parameter situations. Finally, it is shown that this sampling method has been effectively worked in the optimized layout of Huailai remote sensing station in China. The coarse resolution pixel covering this station could be

  6. Pixel Sensors with slim edges and small pitches for the CMS upgrades for HL-LHC

    Energy Technology Data Exchange (ETDEWEB)

    Vernieri, Caterina [Fermilab; Bolla, Gino [Fermilab; Rivera, Ryan [Fermilab; Uplegger, Lorenzo [Fermilab; Zoi, Irene [Fermilab

    2016-01-01

    Planar n-in-n silicon detectors with small pitches and slim edges are being investigated for the innermost layers of tracking devices for the foreseen upgrades of the LHC. Sensor prototypes compatible with the CMS readout, fabricated by Sintef, were tested in the laboratory and with a 120 GeV/c proton beam at the Fermilab test beam facility before and after irradiation with up to 2x1015 neq/cm2 fluence. Preliminary results of the data analysis are presented.

  7. Pixel sensors with slim edges and small pitches for the CMS upgrades for HL-LHC

    Science.gov (United States)

    Vernieri, Caterina; Bolla, Gino; Rivera, Ryan; Uplegger, Lorenzo; Zoi, Irene

    2017-02-01

    Planar n-in-n silicon detectors with small pitches and slim edges are being investigated for the innermost layers of tracking devices for the foreseen upgrades of the LHC experiments. Sensor prototypes compatible with the CMS readout, fabricated by Sintef, were tested in the laboratory and with a 120 GeV/c proton beam at the Fermilab test beam facility before and after irradiation with up to 2×1015 neq/cm2 fluence. Preliminary results of the data analysis are presented.

  8. Pixel Vertex Detectors

    OpenAIRE

    Wermes, Norbert

    2006-01-01

    Pixel vertex detectors are THE instrument of choice for the tracking of charged particles close to the interaction point at the LHC. Hybrid pixel detectors, in which sensor and read-out IC are separate entities, constitute the present state of the art in detector technology. Three of the LHC detectors use vertex detectors based on this technology. A development period of almost 10 years has resulted in pixel detector modules which can stand the extreme rate and timing requirements as well as ...

  9. ATLAS IBL Pixel Upgrade

    CERN Document Server

    La Rosa, A

    2011-01-01

    The upgrade for ATLAS detector will undergo different phase towards super-LHC. The first upgrade for the Pixel detector will consist of the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (LHC phase-I upgrade). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.3 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reducing the pixel size and of the material budget. Three different promising sensor technologies (planar-Si, 3D-Si and diamond) are currently under investigation for the pixel detector. An overview of the project with particular emphasis on pixel module is presented in this paper

  10. Thin n-in-p pixel sensors and the SLID-ICV vertical integration technology for the ATLAS upgrade at the HL-LHC

    Science.gov (United States)

    Macchiolo, A.; Andricek, L.; Ellenburg, M.; Moser, H. G.; Nisius, R.; Richter, R. H.; Terzo, S.; Weigell, P.

    2013-12-01

    This R&D activity is focused on the development of new modules for the upgrade of the ATLAS pixel system at the High Luminosity LHC (HL-LHC). The performance after irradiation of n-in-p pixel sensors of different active thicknesses is studied, together with an investigation of a novel interconnection technique offered by the Fraunhofer Institute EMFT in Munich, the Solid-Liquid-InterDiffusion (SLID), which is an alternative to the standard solder bump-bonding. The pixel modules are based on thin n-in-p sensors, with an active thickness of 75 μm or 150 μm, produced at the MPI Semiconductor Laboratory (MPI HLL) and on 100 μm thick sensors with active edges, fabricated at VTT, Finland. Hit efficiencies are derived from beam test data for thin devices irradiated up to a fluence of 4×1015 neq/cm2. For the active edge devices, the charge collection properties of the edge pixels before irradiation are discussed in detail, with respect to the inner ones, using measurements with radioactive sources. Beyond the active edge sensors, an additional ingredient needed to design four side buttable modules is the possibility of moving the wire bonding area from the chip surface facing the sensor to the backside, avoiding the implementation of the cantilever extruding beyond the sensor area. The feasibility of this process is under investigation with the FE-I3 SLID modules, where Inter Chip Vias are etched, employing an EMFT technology, with a cross section of 3 μm×10 μm, at the positions of the original wire bonding pads.

  11. Thin n-in-p pixel sensors and the SLID-ICV vertical integration technology for the ATLAS upgrade at the HL-LHC

    CERN Document Server

    Macchiolo, A

    2013-01-01

    The R&D activity presented is focused on the development of new modules for the upgrade of the ATLAS pixel system at the High Luminosity LHC (HL-LHC). The performance after irradiation of n-in-p pixel sensors of different active thicknesses is studied, together with an investigation of a novel interconnection technique offered by the Fraunhofer Institute EMFT in Munich, the Solid-Liquid-InterDiffusion (SLID), which is an alternative to the standard solder bump-bonding. The pixel modules are based on thin n-in-p sensors, with an active thickness of 75 um or 150 um, produced at the MPI Semiconductor Laboratory (MPI HLL) and on 100 um thick sensors with active edges, fabricated at VTT, Finland. Hit efficiencies are derived from beam test data for thin devices irradiated up to a fluence of 4e15 neq/cm^2. For the active edge devices, the charge collection properties of the edge pixels before irradiation is discussed in detail, with respect to the inner ones, using measurements with radioactive sources. Beyond ...

  12. Large area CMOS active pixel sensor x-ray imager for digital breast tomosynthesis: Analysis, modeling, and characterization

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Chumin; Kanicki, Jerzy, E-mail: kanicki@eecs.umich.edu [Solid-State Electronics Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109 (United States); Konstantinidis, Anastasios C. [Department of Medical Physics and Biomedical Engineering, University College London, London WC1E 6BT, United Kingdom and Diagnostic Radiology and Radiation Protection, Christie Medical Physics and Engineering, The Christie NHS Foundation Trust, Manchester M20 4BX (United Kingdom); Patel, Tushita [Department of Physics, University of Virginia, Charlottesville, Virginia 22908 (United States)

    2015-11-15

    Purpose: Large area x-ray imagers based on complementary metal-oxide-semiconductor (CMOS) active pixel sensor (APS) technology have been proposed for various medical imaging applications including digital breast tomosynthesis (DBT). The low electronic noise (50–300 e{sup −}) of CMOS APS x-ray imagers provides a possible route to shrink the pixel pitch to smaller than 75 μm for microcalcification detection and possible reduction of the DBT mean glandular dose (MGD). Methods: In this study, imaging performance of a large area (29 × 23 cm{sup 2}) CMOS APS x-ray imager [Dexela 2923 MAM (PerkinElmer, London)] with a pixel pitch of 75 μm was characterized and modeled. The authors developed a cascaded system model for CMOS APS x-ray imagers using both a broadband x-ray radiation and monochromatic synchrotron radiation. The experimental data including modulation transfer function, noise power spectrum, and detective quantum efficiency (DQE) were theoretically described using the proposed cascaded system model with satisfactory consistency to experimental results. Both high full well and low full well (LFW) modes of the Dexela 2923 MAM CMOS APS x-ray imager were characterized and modeled. The cascaded system analysis results were further used to extract the contrast-to-noise ratio (CNR) for microcalcifications with sizes of 165–400 μm at various MGDs. The impact of electronic noise on CNR was also evaluated. Results: The LFW mode shows better DQE at low air kerma (K{sub a} < 10 μGy) and should be used for DBT. At current DBT applications, air kerma (K{sub a} ∼ 10 μGy, broadband radiation of 28 kVp), DQE of more than 0.7 and ∼0.3 was achieved using the LFW mode at spatial frequency of 0.5 line pairs per millimeter (lp/mm) and Nyquist frequency ∼6.7 lp/mm, respectively. It is shown that microcalcifications of 165–400 μm in size can be resolved using a MGD range of 0.3–1 mGy, respectively. In comparison to a General Electric GEN2 prototype DBT system (at

  13. Pixel-level continuous-time incremental sigma-delta A/D converter for THz sensors

    Science.gov (United States)

    Khatib, Moustafa; Perenzoni, Matteo

    2016-04-01

    A readout channel based on continuous-time incremental sigma-delta analog-to-digital converter for FET-based terahertz (THz) imaging applications was implemented in a 0.15 μm standard CMOS technology. The designed readout circuit is suitable for implementation in pixel arrays due to its compact size and power consumption. The system-level analysis used to define the modulator parameters and to specify its analog building blocks is presented. The loop filter has been realized by using a Gm-C integrator. Circuit linearization techniques have been implemented to improve the linearity of the transconductor cell and reduce the impact of parasitic capacitances. Moreover, chopper stabilization technique is adopted in the loop filter, significantly reducing the low-frequency flicker noise thereby preserving the Noise Equivalent Power (NEP) of the FET detector within the required specifications of minimum detectable signal. The resulting input referred noise voltage is 87.5 nV/√Hz . The incremental ADC achieves 68-dB peak signal-to-noise-and-distortion-ratio (SNDR), equivalent to 11 bits effective resolution over 1 kHz signal bandwidth at 1 MHz sampling frequency. In order to meet the requirements of large sensor arrays, a first order architecture is realized. This leads to lower area occupancy and power consumption. The readout circuit draws 80 μW of power from a supply voltage of 1.8 V. The channel occupies an area of 90 x 273μm2.

  14. Front-end electronics in a 65 nm CMOS process for high density readout of pixel sensors

    Science.gov (United States)

    Gaioni, Luigi; Manghisoni, Massimo; Ratti, Lodovico; Re, Valerio; Traversi, Gianluca

    2011-09-01

    In future high energy physics experiments (HEP), readout integrated circuits for vertexing and tracking applications will be implemented by means of CMOS devices belonging to processes with minimum feature size in the 100 nm span. In these nanoscale technologies the impact of new dielectric materials and processing techniques on the analog behavior of MOSFETs has to be carefully evaluated. This paper is concerned with the study of the analog properties, in particular in terms of noise performance and radiation hardness, of MOSFET devices belonging to a 65 nm CMOS low power technology. The behavior of the 1/ f and white noise terms is studied as a function of the main device parameters before and after exposure to 10 keV X-rays and 60Co γ-rays. A prototype chip designed in a 65 nm CMOS process including deep n-well MAPS structures and a fast front-end conceived for the readout of high-resistivity pixel sensors will be introduced.

  15. The APSEL4D Monolithic Active Pixel Sensor and its Usage in a Single Electron Interference Experiment

    CERN Document Server

    Alberghi, Gian Luigi

    We have realized a Data Acquisition chain for the use and characterization of APSEL4D, a 32 x 128 Monolithic Active Pixel Sensor, developed as a prototype for frontier experiments in high energy particle physics. In particular a transition board was realized for the conversion between the chip and the FPGA voltage levels and for the signal quality enhancing. A Xilinx Spartan-3 FPGA was used for real time data processing, for the chip control and the communication with a Personal Computer through a 2.0 USB port. For this purpose a firmware code, developed in VHDL language, was written. Finally a Graphical User Interface for the online system monitoring, hit display and chip control, based on windows and widgets, was realized developing a C++ code and using Qt and Qwt dedicated libraries. APSEL4D and the full acquisition chain were characterized for the first time with the electron beam of the transmission electron microscope and with 55Fe and 90Sr radioactive sources. In addition, a beam test was performed at ...

  16. Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors.

    Science.gov (United States)

    Belloir, Jean-Marc; Goiffon, Vincent; Virmontois, Cédric; Raine, Mélanie; Paillet, Philippe; Duhamel, Olivier; Gaillardin, Marc; Molina, Romain; Magnan, Pierre; Gilard, Olivier

    2016-02-22

    The dark current produced by neutron irradiation in CMOS Image Sensors (CIS) is investigated. Several CIS with different photodiode types and pixel pitches are irradiated with various neutron energies and fluences to study the influence of each of these optical detector and irradiation parameters on the dark current distribution. An empirical model is tested on the experimental data and validated on all the irradiated optical imagers. This model is able to describe all the presented dark current distributions with no parameter variation for neutron energies of 14 MeV or higher, regardless of the optical detector and irradiation characteristics. For energies below 1 MeV, it is shown that a single parameter has to be adjusted because of the lower mean damage energy per nuclear interaction. This model and these conclusions can be transposed to any silicon based solid-state optical imagers such as CIS or Charged Coupled Devices (CCD). This work can also be used when designing an optical imager instrument, to anticipate the dark current increase or to choose a mitigation technique.

  17. Development and characterisation of Monolithic Active Pixel Sensor prototypes for the upgrade of the ALICE Inner Tracking System

    CERN Document Server

    Collu, Alberto

    ALICE (A Large Ion Collider Experiment) is dedicated to the study and characterisation of the Quark-­‐Gluon Plasma (QGP), exploiting the unique potential of ultrarelativistic heavy-­‐ion collisions at the CERN Large Hadron Collider (LHC). The increase of the LHC luminosity leading up to about 50 kHz Pb-­‐Pb interaction rate after the second long shutdown (in 2018-­‐2019) will offer the possibility to perform high precision measurements of rare probes over a wide range of momenta. These measurements are statistically limited or not even possible with the present experimental set up. For this reason, an upgrade strategy for several ALICE detectors is being pursued. In particular, it is foreseen to replace the Inner Tracking System (ITS) by a new detector which will significantly improve the tracking and vertexing capabilities of ALICE in the upgrade scenario. The new ITS will have a barrel geometry consisting of seven layers of Monolithic Active Pixel Sensors (MAPS) with high granularity, which will...

  18. Low-Voltage 96 dB Snapshot CMOS Image Sensor with 4.5 nW Power Dissipation per Pixel

    Directory of Open Access Journals (Sweden)

    Orly Yadid-Pecht

    2012-07-01

    Full Text Available Modern “smart” CMOS sensors have penetrated into various applications, such as surveillance systems, bio-medical applications, digital cameras, cellular phones and many others. Reducing the power of these sensors continuously challenges designers. In this paper, a low power global shutter CMOS image sensor with Wide Dynamic Range (WDR ability is presented. This sensor features several power reduction techniques, including a dual voltage supply, a selective power down, transistors with different threshold voltages, a non-rationed logic, and a low voltage static memory. A combination of all these approaches has enabled the design of the low voltage “smart” image sensor, which is capable of reaching a remarkable dynamic range, while consuming very low power. The proposed power-saving solutions have allowed the maintenance of the standard architecture of the sensor, reducing both the time and the cost of the design. In order to maintain the image quality, a relation between the sensor performance and power has been analyzed and a mathematical model, describing the sensor Signal to Noise Ratio (SNR and Dynamic Range (DR as a function of the power supplies, is proposed. The described sensor was implemented in a 0.18 um CMOS process and successfully tested in the laboratory. An SNR of 48 dB and DR of 96 dB were achieved with a power dissipation of 4.5 nW per pixel.

  19. Low-voltage 96 dB snapshot CMOS image sensor with 4.5 nW power dissipation per pixel.

    Science.gov (United States)

    Spivak, Arthur; Teman, Adam; Belenky, Alexander; Yadid-Pecht, Orly; Fish, Alexander

    2012-01-01

    Modern "smart" CMOS sensors have penetrated into various applications, such as surveillance systems, bio-medical applications, digital cameras, cellular phones and many others. Reducing the power of these sensors continuously challenges designers. In this paper, a low power global shutter CMOS image sensor with Wide Dynamic Range (WDR) ability is presented. This sensor features several power reduction techniques, including a dual voltage supply, a selective power down, transistors with different threshold voltages, a non-rationed logic, and a low voltage static memory. A combination of all these approaches has enabled the design of the low voltage "smart" image sensor, which is capable of reaching a remarkable dynamic range, while consuming very low power. The proposed power-saving solutions have allowed the maintenance of the standard architecture of the sensor, reducing both the time and the cost of the design. In order to maintain the image quality, a relation between the sensor performance and power has been analyzed and a mathematical model, describing the sensor Signal to Noise Ratio (SNR) and Dynamic Range (DR) as a function of the power supplies, is proposed. The described sensor was implemented in a 0.18 um CMOS process and successfully tested in the laboratory. An SNR of 48 dB and DR of 96 dB were achieved with a power dissipation of 4.5 nW per pixel.

  20. Transition-edge sensor pixel parameter design of the microcalorimeter array for the x-ray integral field unit on Athena

    Science.gov (United States)

    Smith, S. J.; Adams, J. S.; Bandler, S. R.; Betancourt-Martinez, G. L.; Chervenak, J. A.; Chiao, M. P.; Eckart, M. E.; Finkbeiner, F. M.; Kelley, R. L.; Kilbourne, C. A.; Miniussi, A. R.; Porter, F. S.; Sadleir, J. E.; Sakai, K.; Wakeham, N. A.; Wassell, E. J.; Yoon, W.; Bennett, D. A.; Doriese, W. B.; Fowler, J. W.; Hilton, G. C.; Morgan, K. M.; Pappas, C. G.; Reintsema, C. N.; Swetz, D. S.; Ullom, J. N.; Irwin, K. D.; Akamatsu, H.; Gottardi, L.; den Hartog, R.; Jackson, B. D.; van der Kuur, J.; Barret, D.; Peille, P.

    2016-07-01

    The focal plane of the X-ray integral field unit (X-IFU) for ESA's Athena X-ray observatory will consist of 4000 transition edge sensor (TES) x-ray microcalorimeters optimized for the energy range of 0.2 to 12 keV. The instrument will provide unprecedented spectral resolution of 2.5 eV at energies of up to 7 keV and will accommodate photon fluxes of 1 mCrab (90 cps) for point source observations. The baseline configuration is a uniform large pixel array (LPA) of 4.28" pixels that is read out using frequency domain multiplexing (FDM). However, an alternative configuration under study incorporates an 18 × 18 small pixel array (SPA) of 2" pixels in the central 36" region. This hybrid array configuration could be designed to accommodate higher fluxes of up to 10 mCrab (900 cps) or alternately for improved spectral performance (report on the TES pixel designs that are being optimized to meet these proposed LPA and SPA configurations. In particular we describe details of how important TES parameters are chosen to meet the specific mission criteria such as energy resolution, count-rate and quantum efficiency, and highlight performance trade-offs between designs. The basis of the pixel parameter selection is discussed in the context of existing TES arrays that are being developed for solar and x-ray astronomy applications. We describe the latest results on DC biased diagnostic arrays as well as large format kilo-pixel arrays and discuss the technical challenges associated with integrating different array types on to a single detector die.

  1. Beam test results of a monolithic pixel sensor in the 0.18 μm tower-jazz technology with high resistivity epitaxial layer

    Energy Technology Data Exchange (ETDEWEB)

    Mattiazzo, S., E-mail: serena.mattiazzo@pd.infn.it [Università degli Studi di Padova, Padova IT 35131 (Italy); Aimo, I. [Politecnico di Torino and Istituto Nazionale di Fisica Nucleare (INFN) Sezione di Torino, Torino IT 10129 (Italy); Baudot, J. [Universitè de Strasbourg, IPHC, Strasbourg F67037 (France); CNRS, MMR7178, Strasbourg F67037 (France); Bedda, C. [Politecnico di Torino and Istituto Nazionale di Fisica Nucleare (INFN) Sezione di Torino, Torino IT 10129 (Italy); La Rocca, P. [Università di Catania and Istituto Nazionale di Fisica Nucleare (INFN) Sezione di Catania, Catania IT 95123 (Italy); Perez, A. [Universitè de Strasbourg, IPHC, Strasbourg F67037 (France); CNRS, MMR7178, Strasbourg F67037 (France); Riggi, F. [Università di Catania and Istituto Nazionale di Fisica Nucleare (INFN) Sezione di Catania, Catania IT 95123 (Italy); Spiriti, E. [Istituto Nazionale di Fisica Nucleare (INFN) Laboratori Nazionali di Frascati and Sezione di Roma 3, Roma IT 00146 (Italy)

    2015-10-01

    The ALICE experiment at CERN will undergo a major upgrade in the second Long LHC Shutdown in the years 2018–2019; this upgrade includes the full replacement of the Inner Tracking System (ITS), deploying seven layers of Monolithic Active Pixel Sensors (MAPS). For the development of the new ALICE ITS, the Tower-Jazz 0.18 μm CMOS imaging sensor process has been chosen as it is possible to use full CMOS in the pixel and different silicon wafers (including high resistivity epitaxial layers). A large test campaign has been carried out on several small prototype chips, designed to optimize the pixel sensor layout and the front-end electronics. Results match the target requirements both in terms of performance and of radiation hardness. Following this development, the first full scale chips have been designed, submitted and are currently under test, with promising results. A telescope composed of 4 planes of Mimosa-28 and 2 planes of Mimosa-18 chips is under development at the DAFNE Beam Test Facility (BTF) at the INFN Laboratori Nazionali di Frascati (LNF) in Italy with the final goal to perform a comparative test of the full scale prototypes. The telescope has been recently used to test a Mimosa-22THRb chip (a monolithic pixel sensor built in the 0.18 μm Tower-Jazz process) and we foresee to perform tests on the full scale chips for the ALICE ITS upgrade at the beginning of 2015. In this contribution we will describe some first measurements of spatial resolution, fake hit rate and detection efficiency of the Mimosa-22THRb chip obtained at the BTF facility in June 2014 with an electron beam of 500 MeV.

  2. Beam test results of a monolithic pixel sensor in the 0.18 μm tower-jazz technology with high resistivity epitaxial layer

    Science.gov (United States)

    Mattiazzo, S.; Aimo, I.; Baudot, J.; Bedda, C.; La Rocca, P.; Perez, A.; Riggi, F.; Spiriti, E.

    2015-10-01

    The ALICE experiment at CERN will undergo a major upgrade in the second Long LHC Shutdown in the years 2018-2019; this upgrade includes the full replacement of the Inner Tracking System (ITS), deploying seven layers of Monolithic Active Pixel Sensors (MAPS). For the development of the new ALICE ITS, the Tower-Jazz 0.18 μm CMOS imaging sensor process has been chosen as it is possible to use full CMOS in the pixel and different silicon wafers (including high resistivity epitaxial layers). A large test campaign has been carried out on several small prototype chips, designed to optimize the pixel sensor layout and the front-end electronics. Results match the target requirements both in terms of performance and of radiation hardness. Following this development, the first full scale chips have been designed, submitted and are currently under test, with promising results. A telescope composed of 4 planes of Mimosa-28 and 2 planes of Mimosa-18 chips is under development at the DAFNE Beam Test Facility (BTF) at the INFN Laboratori Nazionali di Frascati (LNF) in Italy with the final goal to perform a comparative test of the full scale prototypes. The telescope has been recently used to test a Mimosa-22THRb chip (a monolithic pixel sensor built in the 0.18 μm Tower-Jazz process) and we foresee to perform tests on the full scale chips for the ALICE ITS upgrade at the beginning of 2015. In this contribution we will describe some first measurements of spatial resolution, fake hit rate and detection efficiency of the Mimosa-22THRb chip obtained at the BTF facility in June 2014 with an electron beam of 500 MeV.

  3. Beam Test Results of Thin n-in-p 3D and Planar Pixel Sensors for the High Luminosity LHC Tracker Upgrade at CMS

    CERN Document Server

    Zoi, Irene; Dalla Betta, G. F; Dinardo, Mauro; Giacomini, G; Menasce, Dario; Mendicino, R; Meschini, Marco; Messineo, Alberto; Moroni, Luigi; Ronchin, S; Sultan, D.M.S; Uplegger, Lorenzo; Vernieri, Caterina; Viliani, Lorenzo; Zuolo, Davide

    2017-01-01

    This is necessary for the pixel tracker that is the closest to the interaction point and will be replaced. In this paper, the results, from beam tests performed at Fermilab Test Beam Facility, of thin (100 $\\mu$m and 130 $\\mu$m thick) n-in-p type sensors, assembled into hybrid single chip modules bump bonded to the PSI46dig readou...

  4. Design and characterization of a 256 x 64-pixel single-photon imager in CMOS for a MEMS-based laser scanning time-of-flight sensor.

    Science.gov (United States)

    Niclass, Cristiano; Ito, Kota; Soga, Mineki; Matsubara, Hiroyuki; Aoyagi, Isao; Kato, Satoru; Kagami, Manabu

    2012-05-21

    We introduce an optical time-of-flight image sensor taking advantage of a MEMS-based laser scanning device. Unlike previous approaches, our concept benefits from the high timing resolution and the digital signal flexibility of single-photon pixels in CMOS to allow for a nearly ideal cooperation between the image sensor and the scanning device. This technique enables a high signal-to-background light ratio to be obtained, while simultaneously relaxing the constraint on size of the MEMS mirror. These conditions are critical for devising practical and low-cost depth sensors intended to operate in uncontrolled environments, such as outdoors. A proof-of-concept prototype capable of operating in real-time was implemented. This paper focuses on the design and characterization of a 256 x 64-pixel image sensor, which also comprises an event-driven readout circuit, an array of 64 row-level high-throughput time-to-digital converters, and a 16 Gbit/s global readout circuit. Quantitative evaluation of the sensor under 2 klux of background light revealed a repeatability error of 13.5 cm throughout the distance range of 20 meters.

  5. Design and Realisation of Integrated Circuits for the Readout of Pixel Sensors in High Energy Physics and Biomedical Imaging

    CERN Document Server

    Peric, Ivan

    2004-01-01

    Several application specific microchips (ASICs) for the readout of pixel detectors have been designed, tested and described in this thesis. The first chapter gives the detailed description of the pixel-readout chip for the ATLAS pixel detector (FEI). The chip is now in operation as the innermost electronic component of the ATLAS detector. The chip for steering of DEPFET matrix (SWITCHER) is described in the second chapter. The chip is implemented in a high-voltage CMOS technology, it generates fast high voltage signals. Finally, a novel pixel readout chip for a hybrid x-ray pixel detector based on direct conversion is introduced. The chip (CIX) has joint photon counting and integrating capability.

  6. New generation of monolithic active pixel sensors for charged particle detection; Developpement d'un capteur de nouvelle generation et son electronique integree pour les collisionneurs futurs

    Energy Technology Data Exchange (ETDEWEB)

    Deptuch, G

    2002-09-01

    Vertex detectors are of great importance in particle physics experiments, as the knowledge of the event flavour is becoming an issue for the physics programme at Future Linear Colliders. Monolithic Active Pixel Sensors (MAPS) based on a novel detector structure have been proposed. Their fabrication is compatible with a standard CMOS process. The sensor is inseparable from the readout electronics, since both of them are integrated on the same, low-resistivity silicon wafer. The basic pixel configuration comprises only three MOS transistors and a diode collecting the charge through thermal diffusion. The charge is generated in the thin non-depleted epitaxial layer underneath the readout electronics. This approach provides, at low cost, a high resolution and thin device with the whole area sensitive to radiation. Device simulations using the ISE-TCAD package have been carried out to study the charge collection mechanism. In order to demonstrate the viability of the technique, four prototype chips have been fabricated using different submicrometer CMOS processes. The pixel gain has been calibrated using a {sup 55}Fe source and the Poisson sequence method. The prototypes have been exposed to high-energy particle beams at CERN. The tests proved excellent detection performances expressed in a single-track spatial resolution of 1.5 {mu}m and detection efficiency close to 100%, resulting from a SNR ratio of more than 30. Irradiation tests showed immunity of MAPS to a level of a few times 10{sup 12} n/cm{sup 2} and a few hundred kRad of ionising radiation. The ideas for future work, including on-pixel signal amplification, double sampling operation and current mode pixel design are present as well. (author)

  7. Design, Analysis, and Optimization of a CMOS Active Pixel Sensor%CMOS有源像素传感器特性分析与优化设计

    Institute of Scientific and Technical Information of China (English)

    徐江涛; 姚素英; 李斌桥; 史再峰; 高静

    2006-01-01

    A three-transistor active pixel sensor and its double sampling readout circuit implemented by a switch capacitor amplifier are designed. The circuit is embedded in a 64 × 64 pixel array CMOS image sensor and success fully taped out with a Chartered 0.35μm process. The pixel pitch is 8μm × 8μm with a fill factor of 57% ,the photo-sensitivity is 0.8V/(lux · s) ,and the dynamic range is 50dB. Theoretical analysis and test results indicate that as the process is scaled down, a smaller pixel pitch reduces the sensitivity. A deep junction n-well/p-substrate photodiode with a reasonable fill factor and high sensitivity are more appropriate for submicron processes.%设计了一个三管有源像素和其用开关电容放大器实现的双采样读出电路.该电路被嵌入一64×64像素阵列CMOS图像传感器,在Chartered公司0.35μm工艺线上成功流片.在8μm×8μm像素尺寸下实现了57%的填充因子.测得可见光响应灵敏度为0.8V/(lux·s),动态范围为50dB.理论分析和实验结果表明随着工艺尺寸缩小,像素尺寸减小会使光响应灵敏度降低.在深亚微米工艺条件下,较深的n阱/p衬底结光电二极管可以提供合理的填充因子和光响应灵敏度.

  8. Charge collection and non-ionizing radiation tolerance of CMOS pixel sensors using a 0.18 μm CMOS process

    Science.gov (United States)

    Zhang, Ying; Zhu, Hongbo; Zhang, Liang; Fu, Min

    2016-09-01

    The proposed Circular Electron Positron Collider (CEPC) will be primarily aimed for precision measurements of the discovered Higgs boson. Its innermost vertex detector, which will play a critical role in heavy-flavor tagging, must be constructed with fine-pitched silicon pixel sensors with low power consumption and fast readout. CMOS pixel sensor (CPS), as one of the most promising candidate technologies, has already demonstrated its excellent performance in several high energy physics experiments. Therefore it has been considered for R&D for the CEPC vertex detector. In this paper, we present the preliminary studies to improve the collected signal charge over the equivalent input capacitance ratio (Q / C), which will be crucial to reduce the analog power consumption. We have performed detailed 3D device simulation and evaluated potential impacts from diode geometry, epitaxial layer properties and non-ionizing radiation damage. We have proposed a new approach to improve the treatment of the boundary conditions in simulation. Along with the TCAD simulation, we have designed the exploratory prototype utilizing the TowerJazz 0.18 μm CMOS imaging sensor process and we will verify the simulation results with future measurements.

  9. A time-of-flight range image sensor using high-speed 4-tap lock-in pixels

    Science.gov (United States)

    Komazawa, A.; Trang, H.; Takasawa, T.; Aoyama, S.; Yasutomi, K.; Kagawa, K.; Kawahito, S.

    2017-02-01

    This paper presents a CMOS Time-of-Flight (TOF) range imager using pinned-photodiode based high-speed 4-tap lock-in pixels with lateral-electric-field charge modulators (LEFM) in a 0.11 um CIS process. The proposed lock-in pixel structure using lateral electric field control is suitable for implementing a multiple-tap charge modulator while achieving high-speed charge transfer for high time resolution. The TOF imager with the multiple-tap charge modulators is expected to have background light cancelling capability in one frame and to improve range resolution with the 4 time windows for a range-shifted light pulse. Measurement results of the implemented TOF imager with 160×240 pixels are reported.

  10. Characterization of Thin Pixel Sensor Modules Interconnected with SLID Technology Irradiated to a Fluence of 2$\\cdot 10^{15}$\\,n$_{\\mathrm{eq}}$/cm$^2$

    CERN Document Server

    INSPIRE-00237859; Beimforde, M.; Macchiolo, A.; Moser, H.G.; Nisius, R.; Richter, R.H.

    2011-01-01

    A new module concept for future ATLAS pixel detector upgrades is presented, where thin n-in-p silicon sensors are connected to the front-end chip exploiting the novel Solid Liquid Interdiffusion technique (SLID) and the signals are read out via Inter Chip Vias (ICV) etched through the front-end. This should serve as a proof of principle for future four-side buttable pixel assemblies for the ATLAS upgrades, without the cantilever presently needed in the chip for the wire bonding. The SLID interconnection, developed by the Fraunhofer EMFT, is a possible alternative to the standard bump-bonding. It is characterized by a very thin eutectic Cu-Sn alloy and allows for stacking of different layers of chips on top of the first one, without destroying the pre-existing bonds. This paves the way for vertical integration technologies. Results of the characterization of the first pixel modules interconnected through SLID as well as of one sample irradiated to $2\\cdot10^{15}$\\,\

  11. Characterization of Thin Pixel Sensor Modules Interconnected with SLID Technology Irradiated to a Fluence of 2⋅10 15 $n_{eq}$ /cm 2

    CERN Document Server

    Weigell, P; Beimforde, M; Macchiolo, A; Moser, H G; Nisius, R; Richter, R H

    2011-01-01

    A new module concept for future ATLAS pixel detector upgrades is presented, where thin n-in-p silicon sensors are connected to the front-end chip exploiting the novel Solid Liquid Interdiffusion technique (SLID) and the signals are read out via Inter Chip Vias (ICV) etched through the front-end. This should serve as a proof of principle for future four-side buttable pixel assemblies for the ATLAS upgrades, without the cantilever presently needed in the chip for the wire bonding. The SLID interconnection, developed by the Fraunhofer EMFT, is a possible alternative to the standard bump-bonding. It is characterized by a very thin eutectic Cu-Sn alloy and allows for stacking of different layers of chips on top of the first one, without destroying the pre-existing bonds. This paves the way for vertical integration technologies. Results of the characterization of the first pixel modules interconnected through SLID as well as of one sample irradiated to 2⋅10 15 \\,\

  12. Amorphous In–Ga–Zn–O thin-film transistor active pixel sensor x-ray imager for digital breast tomosynthesis

    Energy Technology Data Exchange (ETDEWEB)

    Zhao, Chumin; Kanicki, Jerzy, E-mail: kanicki@eecs.umich.edu [Solid-State Electronic Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109 (United States)

    2014-09-15

    Purpose: The breast cancer detection rate for digital breast tomosynthesis (DBT) is limited by the x-ray image quality. The limiting Nyquist frequency for current DBT systems is around 5 lp/mm, while the fine image details contained in the high spatial frequency region (>5 lp/mm) are lost. Also today the tomosynthesis patient dose is high (0.67–3.52 mGy). To address current issues, in this paper, for the first time, a high-resolution low-dose organic photodetector/amorphous In–Ga–Zn–O thin-film transistor (a-IGZO TFT) active pixel sensor (APS) x-ray imager is proposed for next generation DBT systems. Methods: The indirect x-ray detector is based on a combination of a novel low-cost organic photodiode (OPD) and a cesium iodide-based (CsI:Tl) scintillator. The proposed APS x-ray imager overcomes the difficulty of weak signal detection, when small pixel size and low exposure conditions are used, by an on-pixel signal amplification with a significant charge gain. The electrical performance of a-IGZO TFT APS pixel circuit is investigated by SPICE simulation using modified Rensselaer Polytechnic Institute amorphous silicon (a-Si:H) TFT model. Finally, the noise, detective quantum efficiency (DQE), and resolvability of the complete system are modeled using the cascaded system formalism. Results: The result demonstrates that a large charge gain of 31–122 is achieved for the proposed high-mobility (5–20 cm{sup 2}/V s) amorphous metal-oxide TFT APS. The charge gain is sufficient to eliminate the TFT thermal noise, flicker noise as well as the external readout circuit noise. Moreover, the low TFT (<10{sup −13} A) and OPD (<10{sup −8} A/cm{sup 2}) leakage currents can further reduce the APS noise. Cascaded system analysis shows that the proposed APS imager with a 75 μm pixel pitch can effectively resolve the Nyquist frequency of 6.67 lp/mm, which can be further improved to ∼10 lp/mm if the pixel pitch is reduced to 50 μm. Moreover, the

  13. Chromatic X-Ray imaging with a fine pitch CdTe sensor coupled to a large area photon counting pixel ASIC

    CERN Document Server

    Bellazzini, R; Brez, A; Minuti, M; Pinchera, M; Mozzo, P

    2012-01-01

    An innovative X-ray imaging sensor with intrinsic digital characteristics is presented. It is based on Chromatic Photon Counting technology. The detector is able to count individually the incident X-ray photons and to separate them according to their energy (two 'color' images per exposure). The energy selection occurs in real time and at radiographic imaging speed (GHz global counting rate). Photon counting, color mode and a very high spatial resolution (more than 10 l.p./mm at MTF50) allow to obtain an optimal ratio between image quality and absorbed dose. The individual block of the imaging system is a two-side buttable semiconductor radiation detector made of a thin pixellated CdTe crystal (the sensor) coupled to a large area VLSI CMOS pixel ASIC. 1, 2, 4, 8 tile units have been built. The 8 tiles unit has 25cm x 2.5cm sensitive area. Results and images obtained from in depth testing of several configurations of the system are presented. The X-Ray imaging system is the technological platform of PIXIRAD Im...

  14. Pixel Experiments

    DEFF Research Database (Denmark)

    Petersen, Kjell Yngve; Søndergaard, Karin; Augustesen, Christina

    2015-01-01

    Pixel Experiments The term pixel is traditionally defined as any of the minute elements that together constitute a larger context or image. A pixel has its own form and is the smallest unit seen within a larger structure. In working with the potentials of LED technology in architectural lighting...... design it became relevant to investigate the use of LEDs as the physical equivalent of a pixel as a design approach. In this book our interest has been in identifying how the qualities of LEDs can be used in lighting applications. With experiences in the planning and implementation of architectural...... elucidate and exemplify already well-known problems in relation to the experience of vertical and horizontal lighting. Pixel Experiments exist as a synergy between speculative test setups and lighting design in practice. This book is one of four books that is published in connection with the research...

  15. Design and First Tests of a Radiation-Hard Pixel Sensor for the European X-Ray Free-Electron Laser

    CERN Document Server

    Schwandt, Joern; Klanner, Robert; Kopsalis, Ioannis; Zhang, Jiaguo

    2014-01-01

    The high intensity and high repetition rate of the European X-ray Free-Electron Laser, presently under construction in Hamburg, requires silicon sensors which can stand X-ray doses of up to 1 GGy for 3 years of operation at high bias voltage. Within the AGIPD Collaboration the X-ray-radiation damage in MOS Capacitors and Gate-Controlled Diodes fabricated by four vendors on high-ohmic n-type silicon with two crystal orientations and dif- ferent technological parameters, has been studied for doses between 1 kGy and 1 GGy. The extracted values of oxide-charge and surface-current densi- ties have been used in TCAD simulations, and the layout and technological parameters of the AGIPD pixel sensor optimized. It is found that the op- timized layout for high X-ray doses is significantly different from the one for non-irradiated sensors. First sensors and test structures have been de-livered in early 2013. Measurement results for X-ray doses of 0 to 10 MGy and their comparison to simulations are presented. They demons...

  16. A Racio-Economic Analysis of Teach for America: Counterstories of TFA Teachers of Color

    Science.gov (United States)

    Lapayese, Yvette V.; Aldana, Ursula S.; Lara, Eduardo

    2014-01-01

    This article discusses Teach for America (TFA), one of the alternative education programs of the U.S. Department of Education designed to address the achievement gap of students of color in the country. Topics explored in this research include issues of racism and race in the recruitment and support of its teacher corp; how TFA educators of color…

  17. ATLAS-IBL Pixel Upgrade

    CERN Document Server

    LaRosa, A; The ATLAS collaboration

    2010-01-01

    The upgrade for the ATLAS detector will undergo different phase towards Super-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (SLHC Phase I). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.2 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reduction of the pixel size and of the material budget. Three different promising sensor technologies (Planar-Si, 3D-Si and Diamond) are currently under investigation for the pixel detector. An overview of the project with particular emphasis on pixel module studies, irradiation and beam test plans will be presented.

  18. Frequency-domain fluorescence lifetime imaging system (pco.flim) based on a in-pixel dual tap control CMOS image sensor

    Science.gov (United States)

    Franke, Robert; Holst, Gerhard A.

    2015-03-01

    The luminescence lifetime as a beneficial analytical parameter is known for many years and is well described by a large variety of publications. Many instruments including 2D measuring systems with cameras have been developed and applied in the past years. However, since the current instrumentation to perform either time- or frequency-domain lifetime measurements is rather complex, new developments in CMOS image sensor technology have achieved to create new image sensors, which can efficiently be integrated into easier-to-handle luminescence lifetime measuring systems. The principle of these modulatable CMOS image sensors, while initially being designed for distance measurements, shows a clear analogy to frequency-domain FLIM measurements, which was proven by researchers [1, 2]. Based on this principle a new CMOS image sensor has been developed, integrated into a camera system and has been investigated within a research project. The image sensor has a resolution of 1024 × 1024 pixels with a 5.6 μm pitch and can be modulated up to 50 MHz. First measurements show an effective dynamic range of larger than 1:1024 (corresponding to 10 bit dynamic). The maximum frame rate is in the range of 90 frames/s in dual-tap mode, resulting in an effective lifetime image frame rate for realistic measurements of approximately 22 frames/s. The camera system pco.flim, featuring that image sensor, generates all required modulation signals from 5 kHz to 50 MHz (sinusoidal and rectangular). It performs advanced pixel correction to generate linear and high-quality images, while the basic lifetime image processing is done in the computer. The modulation frequency can be freely adjusted within the specified range. The characteristics of the camera systems are presented, and first results are discussed using different representations of the data like for example the phasor approach [3], which has been established to provide a more global view to pixelwise fluorescence lifetime data and

  19. Studies for a 10{mu}s, thin, high resolution CMOS pixel sensor for future vertex detectors

    Energy Technology Data Exchange (ETDEWEB)

    Voutsinas, G. [IPHC/IN2P3/CNRS and Universite de Strasbourg, Strasbourg (France); Amar-Youcef, S. [IFK, Goethe-Universitaet, Frankfurt am Main (Germany); Baudot, J.; Bertolone, G.; Brogna, A.; Chon-Sen, N.; Claus, G.; Colledani, C.; Dorokhov, A.; Doziere, G.; Dulinski, W. [IPHC/IN2P3/CNRS and Universite de Strasbourg, Strasbourg (France); Degerli, Y. [IRFU / SEDI (CEA) Saclay (France); De Masi, R. [IPHC/IN2P3/CNRS and Universite de Strasbourg, Strasbourg (France); Deveaux, M. [IFK, Goethe-Universitaet, Frankfurt am Main (Germany); Gelin, M.; Goffe, M.; Hu-Guo, Ch.; Himmi, A.; Jaaskelainen, K.; Koziel, M. [IPHC/IN2P3/CNRS and Universite de Strasbourg, Strasbourg (France)

    2011-06-15

    Future high energy physics (HEP) experiments require detectors with unprecedented performances for track and vertex reconstruction. These requirements call for high precision sensors, with low material budget and short integration time. The development of CMOS sensors for HEP applications was initiated at IPHC Strasbourg more than 10 years ago, motivated by the needs for vertex detectors at the International Linear Collider (ILC) [R. Turchetta et al, NIM A 458 (2001) 677]. Since then several other applications emerged. The first real scale digital CMOS sensor MIMOSA26 equips Flavour Tracker at RHIC, as well as for the microvertex detector of the CBM experiment at FAIR. MIMOSA sensors may also offer attractive performances for the ALICE upgrade at LHC. This paper will demonstrate the substantial performance improvement of CMOS sensors based on a high resistivity epitaxial layer. First studies for integrating the sensors into a detector system will be addressed and finally the way to go to a 10{mu}s readout sensor will be discussed.

  20. Pixel Detectors

    OpenAIRE

    Wermes, Norbert

    2005-01-01

    Pixel detectors for precise particle tracking in high energy physics have been developed to a level of maturity during the past decade. Three of the LHC detectors will use vertex detectors close to the interaction point based on the hybrid pixel technology which can be considered the state of the art in this field of instrumentation. A development period of almost 10 years has resulted in pixel detector modules which can stand the extreme rate and timing requirements as well as the very harsh...

  1. Beam Test Studies of 3D Pixel Sensors Irradiated Non-Uniformly for the ATLAS Forward Physics Detector

    Science.gov (United States)

    2013-02-21

    configuration consists of two n-type readout electrodes connected at the wafer surface along the 250 µm long pixel di- rection, surrounded by six p-type...passivation step uses dielectric material that depends on the bulk type of the silicon. For p-type wafers used in this study, a dielectric with negative...region by applying the SCP technology, from the original 1 mm to 50 − 100µm. The devices were returned to Barcelona to be bump -bonded to FE-I3 readout

  2. A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for monolithie active pixel sensors

    CERN Document Server

    Dahoumane, M; Bouvier, J; Lagorio, E; Hostachy, J Y; Gallin-Martel, L; Hostachy, J Y; Rossetto, O; Hu, Y; Ghazlane, H; Dallet, D

    2007-01-01

    A 4 bit very low power and low incoming signal analog to digital converter (ADC) using a double sampling switched capacitor technique, designed for use in CMOS monolithic active pixels sensor readout, has been implemented in 0.35μm CMOS technology. A non-resetting sample and hold stage is integrated to amplify the incoming signal by 4. This first stage compensates both the amplifier offset effect and the input common mode voltage fluctuations. The converter is composed of a 2.5 bit pipeline stage followed by a 2 bit flash stage. This prototype consists of 4 ADC double-channels; each one is sampling at 50MS/s and dissipates only 2.6mW at 3.3V supply voltage. A bias pulsing stage is integrated in the circuit. Therefore, the analog part is switched OFF or ON in less than 1μs. The size for the layout is 80μm*0.9mm. This corresponds to the pitch of 4 pixel columns, each one is 20μm wide.

  3. On-chip Phase Locked Loop (PLL) design for clock multiplier in CMOS Monolithic Active Pixel Sensors (MAPS)

    CERN Document Server

    Sun, Q; Valin, I; Claus, G; Hu-Guo, Ch; Hu, Yu

    2009-01-01

    In a detector system, clock distribution to sensors must be controlled at a level allowing proper synchronisation. In order to reach theses requirements for the HFT (Heavy Flavor Tracker) upgrade at STAR (Solenoidal Tracker at RHIC), we have proposed to distribute a low frequency clock at 10 MHz which will be multiplied to 160 MHz in each sensor by a PLL. A PLL has been designed for period jitter less than 20 ps rms, low power consumption and manufactured in a 0.35 μm CMOS process.

  4. First detective quantum efficiency measurement of 500 {mu}m silicon hybrid pixel sensor with photon counting readout for X-ray medical imaging

    Energy Technology Data Exchange (ETDEWEB)

    Surre, Benjamin [Laboratoire de Biophysique medicale, University of Auvergne, Clermont-Ferrand (France)]. E-mail: Benjamin.surre@u-clermontl.fr; Caria, Mario [Laboratoire de Biophysique medicale, University of Auvergne, Clermont-Ferrand (France); Chaput, Julien [Laboratoire de Biophysique medicale, University of Auvergne, Clermont-Ferrand (France); Hassoun, Thierry [Laboratoire de Biophysique medicale, University of Auvergne, Clermont-Ferrand (France); Laverroux, Fabien [Laboratoire de Biophysique medicale, University of Auvergne, Clermont-Ferrand (France); Sarry, Laurent [Equipe de Recherche en Signal et Imagerie Medicale, EA3295, Clermont-Ferrand (France)

    2005-07-01

    We report the performances of a 500 {mu}m pixellated silicon sensor bonded to the photon counting chip Medipix2 [1]. In order to perform an absolute characterization of our detector, we measured both the pre-sampling MTF and NPS with respect to the International standard IEC-62220-1. From those data we have been able to extract the Detective Quantum Efficiency (DQE) and hence to assess the suitability of our detector for X-ray medical imaging purpose. Due to poor absorption of the Si at 70 kV the DQE peaked at 0.06 for null frequency. Nevertheless, these results are very promising since thicker Si or more absorbing material such as GaAs will soon be available.

  5. Selected results from the static characterization of edgeless n-on-p planar pixel sensors for ATLAS upgrades

    CERN Document Server

    Giacomini, Gabriele; Bomben, Marco; Boscardin, Maurizio; Bosisio, Luciano; Calderini, Giovanni; Chauveau, Jacques; La Rosa, Alessandro; Marchiori, Giovanni; Zorzi, Nicola

    2014-01-01

    In view of the LHC upgrade for the High Luminosity Phase (HL-LHC), the ATLAS experiment is planning to replace the Inner Detector with an all-Silicon system. The n-on-p technology represents a valid solution for the modules of most of the layers, given the significant radiation hardness of this option and the reduced cost. There is also the demand to reduce the inactive areas to a minimum. The ATLAS LPNHE Paris group and FBK Trento started a collaboration for the development on a novel n-on-p edgeless planar pixel design, based on the deep-trench process which can cope with all these requirements. This paper reports selected results from the electrical characterization, both before and after irradiation, of test structures from the first production batch.

  6. Measurement of charm and beauty-production in deep inelastic scattering at HERA and test beam studies of ATLAS pixel sensors

    Energy Technology Data Exchange (ETDEWEB)

    Libov, Vladyslav

    2013-08-15

    A measurement of charm and beauty production in Deep Inelastic Scattering at HERA is presented. The analysis is based on the data sample collected by the ZEUS detector in the period from 2003 to 2007 corresponding to an integrated luminosity of 354 pb{sup -1}. The kinematic region of the measurement is given by 54.2(5) GeV for charm (beauty) and -1.6<{eta}{sup jet}<2.2 for both charm and beauty, where E{sup jet}{sub T} and {eta}{sup jet} are the transverse energy and pseudorapidity of the jet, respectively. The significance of the decay length and the invariant mass of charged tracks associated with the secondary vertex are used as discriminating variables to distinguish between signal and background. Differential cross sections of jet production in charm and beauty events as a function of Q{sup 2}, y, E{sup jet}{sub T} and {eta}{sup jet} are measured. Results are compared to Next-to-Leading Order (NLO) predictions from Quantum Chromodynamics (QCD) in the fixed flavour number scheme. Good agreement between data and theory is observed. Contributions of the charm and beauty production to the inclusive proton structure function, F{sup cbar} {sup c}{sub 2} and F{sup b} {sup anti} {sup b}{sub 2}, are determined by extrapolating the double differential cross sections using NLO QCD predictions. Contributions to the test beam program for the Insertable B-Layer upgrade project of the ATLAS pixel detector are discussed. The test beam data analysis software package EUTelescope was extended, which allowed an efficient analysis of ATLAS pixel sensors. The USBPix DAQ system was integrated into the EUDET telescope allowing test beam

  7. CVD diamond pixel detectors for LHC experiments

    Energy Technology Data Exchange (ETDEWEB)

    Wedenig, R.; Adam, W.; Bauer, C.; Berdermann, E.; Bergonzo, P.; Bogani, F.; Borchi, E.; Brambilla, A.; Bruzzi, M.; Colledani, C.; Conway, J.; Dabrowski, W.; Delpierre, P.; Deneuville, A.; Dulinski, W.; Eijk, B. van; Fallou, A.; Fizzotti, F.; Foulon, F.; Friedl, M.; Gan, K.K.; Gheeraert, E.; Grigoriev, E.; Hallewell, G.; Hall-Wilton, R.; Han, S.; Hartjes, F.; Hrubec, J.; Husson, D.; Kagan, H.; Kania, D.; Kaplon, J.; Karl, C.; Kass, R.; Knoepfle, K.T.; Krammer, M.; Logiudice, A.; Lu, R.; Manfredi, P.F.; Manfredotti, C.; Marshall, R.D.; Meier, D.; Mishina, M.; Oh, A.; Pan, L.S.; Palmieri, V.G.; Pernicka, M.; Peitz, A.; Pirollo, S.; Polesello, P.; Pretzl, K.; Procario, M.; Re, V.; Riester, J.L.; Roe, S.; Roff, D.; Rudge, A.; Runolfsson, O.; Russ, J.; Schnetzer, S.; Sciortino, S.; Speziali, V.; Stelzer, H.; Stone, R.; Suter, B.; Tapper, R.J.; Tesarek, R.; Trawick, M.; Trischuk, W.; Vittone, E.; Wagner, A.; Walsh, A.M.; Weilhammer, P.; White, C.; Zeuner, W.; Ziock, H.; Zoeller, M.; Blanquart, L.; Breugnion, P.; Charles, E.; Ciocio, A.; Clemens, J.C.; Dao, K.; Einsweiler, K.; Fasching, D.; Fischer, P.; Joshi, A.; Keil, M.; Klasen, V.; Kleinfelder, S.; Laugier, D.; Meuser, S.; Milgrome, O.; Mouthuy, T.; Richardson, J.; Sinervo, P.; Treis, J.; Wermes, N

    1999-08-01

    This paper reviews the development of CVD diamond pixel detectors. The preparation of the diamond pixel sensors for bump-bonding to the pixel readout electronics for the LHC and the results from beam tests carried out at CERN are described.

  8. Evaluation of test structures for the novel n{sup +}-in-p pixel and strip sensors for very high radiation environments

    Energy Technology Data Exchange (ETDEWEB)

    Unno, Y., E-mail: yoshinobu.unno@kek.jp [Institute of Particle and Nuclear Study, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba-shi 305-0801 (Japan); The Graduate University for Advanced Studies (SOKENDAI), 1-1 Oho, Tsukuba-shi 305-0801 (Japan); Mitsui, S. [The Graduate University for Advanced Studies (SOKENDAI), 1-1 Oho, Tsukuba-shi 305-0801 (Japan); Hori, R.; Ikegami, Y.; Terada, S. [Institute of Particle and Nuclear Study, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba-shi 305-0801 (Japan); Kamada, S.; Yamamura, K. [Solid-state Division, Hamamatsu Photonics K.K., 1126-1 Ichino-cho, Higashi-ku, Hamamatsu-shi 435-8558 (Japan); Hanagaki, K. [Department of Physics, Osaka University, Machikaneyama-cho, Toyonaka-shi, Osaka 560-0043 (Japan); Hara, K. [Institute of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba-shi 305-8571 (Japan); Jinnouchi, O. [Department of Physics, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo 152-8550 (Japan); Kimura, N. [Research Institute for Science and Engineering, Waseda University, 1-6-1 Nishi-Waseda, Shinjuku-ku, Tokyo 169-8050 (Japan); Nagai, K. [Institute of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennoudai, Tsukuba-shi 305-8571 (Japan); Nakano, I. [Department of Physics, Okayama University, 3-1-1 Tshushima-naka, Kita-ku, Okayama-shi 700-8530 (Japan); Oda, S. [Department of Physics, Kyushu University, 6-10-11 Hakozaki, Higashi-ku, Fukuoka-shi 812-8581 (Japan); Takashima, R. [Department of Education, Kyoto University of Education, 1 Fukakusa-Fujimori-cho, Fushimi-ku, Kyoto 612-8522 (Japan); Takubo, Y. [Institute of Particle and Nuclear Study, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba-shi 305-0801 (Japan); Tojo, J. [Department of Physics, Kyushu University, 6-10-11 Hakozaki, Higashi-ku, Fukuoka-shi 812-8581 (Japan); and others

    2013-12-11

    Radiation-tolerant n{sup +}-in-p silicon sensors were developed for use in very high radiation environments. Novel n{sup +}-in-p silicon strip and pixel sensors and test structures were fabricated, tested and evaluated, in order to understand the designs implemented. The resistance between the n{sup +} implants (interstrip resistance), the electric potential of the p-stop, and the punch-through-protection (PTP) onset voltage were measured before and as a function of fluence after irradiation. The technology computer-aided design (TCAD) simulations were used to understand the radiation damage and fluence dependence of the structures. The decrease in the interstrip resistance is a consequence of increased leakage current. The decrease in the electric potential of the p-stop results from a build-up of positive charge in the silicon–silicon oxide interface. The decrease and subsequent increase in the PTP onset voltages results from the interface charge build-up and an increase in acceptor states.

  9. Charged particle detection performances of CMOS pixel sensors produced in a 0.18 um process with a high resistivity epitaxial layer

    CERN Document Server

    Senyukov, Serhiy; Besson, Auguste; Claus, Gilles; Cousin, Loic; Dorokhov, Andrei; Dulinski, Wojciech; Goffe, Mathieu; Hu-Guo, Christine; Winter, Marc

    2013-01-01

    The apparatus of the ALICE experiment at CERN will be upgraded in 2017/18 during the second long shutdown of the LHC (LS2). A major motivation for this upgrade is to extend the physics reach for charmed and beauty particles down to low transverse momenta. This requires a substantial improvement of the spatial resolution and the data rate capability of the ALICE Inner Tracking System (ITS). To achieve this goal, the new ITS will be equipped with 50 um thin CMOS Pixel Sensors (CPS) covering either the 3 innermost layers or all the 7 layers of the detector. The CPS being developed for the ITS upgrade at IPHC (Strasbourg) is derived from the MIMOSA 28 sensor realised for the STAR-PXL at RHIC in a 0.35 um CMOS process. In order to satisfy the ITS upgrade requirements in terms of readout speed and radiation tolerance, a CMOS process with a reduced feature size and a high resistivity epitaxial layer should be exploited. In this respect, the charged particle detection performance and radiation hardness of the TowerJa...

  10. Investigation of Properties of Novel Silicon Pixel Assemblies Employing Thin n-in-p Sensors and 3D-Integration

    CERN Document Server

    Weigell, Philipp

    Until the end of the 2020 decade the LHC programme will be defining the high energy frontier of particle physics. During this time, three upgrade steps of the accelerator are currently planned to further increase the luminosity and energy reach. In the course of these upgrades the specifications of several parts of the current LHC detectors will be exceeded. Especially, the innermost tracking detectors are challenged by the increasing track densities and the radiation damage. This thesis focuses on the implications for the ATLAS experiment. Here, around 2021/2, after having collected an integrated luminosity of around 300/fb¹ , the silicon and gas detector components of the inner tracker will reach the end of their lifetime and will need to be replaced to ensure sufficient performance for continued running|especially if the luminosity is raised to about 5x10^35/(cm²s¹ ) as currently planned. An all silicon inner detector is foreseen to be installed. This upgrade demands cost-effective pixel assemblies with...

  11. The Dexela 2923 CMOS X-ray detector: A flat panel detector based on CMOS active pixel sensors for medical imaging applications

    Science.gov (United States)

    Konstantinidis, Anastasios C.; Szafraniec, Magdalena B.; Speller, Robert D.; Olivo, Alessandro

    2012-10-01

    Complementary metal-oxide-semiconductors (CMOS) active pixel sensors (APS) have been introduced recently in many scientific applications. This work reports on the performance (in terms of signal and noise transfer) of an X-ray detector that uses a novel CMOS APS which was developed for medical X-ray imaging applications. For a full evaluation of the detector's performance, electro-optical and X-ray characterizations were carried out. The former included measuring read noise, full well capacity and dynamic range. The latter, which included measuring X-ray sensitivity, presampling modulation transfer function (pMTF), noise power spectrum (NPS) and the resulting detective quantum efficiency (DQE), was assessed under three beam qualities (28 kV, 50 kV (RQA3) and 70 kV (RQA5) using W/Al) all in accordance with the IEC standard. The detector features an in-pixel option for switching the full well capacity between two distinct modes, high full well (HFW) and low full well (LFW). Two structured CsI:Tl scintillators of different thickness (a “thin” one for high resolution and a thicker one for high light efficiency) were optically coupled to the sensor array to optimize the performance of the system for different medical applications. The electro-optical performance evaluation of the sensor results in relatively high read noise (∼360 e-), high full well capacity (∼1.5×106 e-) and wide dynamic range (∼73 dB) under HFW mode operation. When the LFW mode is used, the read noise is lower (∼165) at the expense of a reduced full well capacity (∼0.5×106 e-) and dynamic range (∼69 dB). The maximum DQE values at low frequencies (i.e. 0.5 lp/mm) are high for both HFW (0.69 for 28 kV, 0.71 for 50 kV and 0.75 for 70 kV) and LFW (0.69 for 28 kV and 0.7 for 50 kV) modes. The X-ray performance of the studied detector compares well to that of other mammography and general radiography systems, obtained under similar experimental conditions. This demonstrates the suitability

  12. Hydrogenated Amorphous Silicon Sensor Deposited on Integrated Circuit for Radiation Detection

    CERN Document Server

    Despeisse, M; Jarron, P; Kaplon, J; Moraes, D; Nardulli, A; Powolny, F; Wyrsch, N

    2008-01-01

    Radiation detectors based on the deposition of a 10 to 30 mum thick hydrogenated amorphous silicon (a-Si:H) sensor directly on top of integrated circuits have been developed. The performance of this detector technology has been assessed for the first time in the context of particle detectors. Three different circuits were designed in a quarter micron CMOS technology for these studies. The so-called TFA (Thin-Film on ASIC) detectors obtained after deposition of a-Si:H sensors on the developed circuits are presented. High internal electric fields (104 to 105 V/cm) can be built in the a-Si:H sensor and overcome the low mobility of electrons and holes in this amorphous material. However, the deposited sensor's leakage current at such fields turns out to be an important parameter which limits the performance of a TFA detector. Its detailed study is presented as well as the detector's pixel segmentation. Signal induction by generated free carrier motion in the a-Si:H sensor has been characterized using a 660 nm pul...

  13. Status of the ATLAS pixel detector

    CERN Document Server

    Saavedra Aldo, F

    2005-01-01

    The ATLAS pixel detector is currently being constructed and will be installed in 2006 to be ready for commissioning at the Large Hadron Collider. The complete pixel detector is composed of three concentric barrels and six disks that are populated by 1744 ATLAS Pixel modules. The main components of the pixel module are the readout electronics and the silicon sensor whose active region is instrumented with rectangular pixels. The module has been designed to be able to survive 10 years of operation within the ATLAS detector. A brief description of the pixel detector will be presented with results and problems encountered during the production stage.

  14. Development of enhanced double-sided 3D radiation sensors for pixel detector upgrades at HL-LHC

    CERN Document Server

    Povoli, Marco

    The upgrades of High Energy Physics (HEP) experiments at the Large Hadron Collider (LHC) will call for new radiation hard technologies to be applied in the next generations of tracking devices that will be required to withstand extremely high radiation doses. In this sense, one of the most promising approaches to silicon detectors, is the so called 3D technology. This technology realizes columnar electrodes penetrating vertically into the silicon bulk thus decoupling the active volume from the inter-electrode distance. 3D detectors were first proposed by S. Parker and collaborators in the mid ’90s as a new sensor geometry intended to mitigate the effects of radiation damage in silicon. 3D sensors are currently attracting growing interest in the field of High Energy Physics, despite their more complex and expensive fabrication, because of the much lower operating voltages and enhanced radiation hardness. 3D technology was also investigated in other laboratories, with the intent of reducing the fabrication co...

  15. Development of Low AC Loss TFA-MOD Coated Conductors

    Science.gov (United States)

    Katayama, K.; Machi, T.; Nakamura, T.; Takagi, Y.; Nakaoka, K.; Yoshizumi, M.; Izumi, T.; Shiohara, Y.

    TFA-MOD process is expected to be promising for future applications since it can produce high performance YBCO coated conductors (CCs) with low cost. Applying YBCO CCs to the power electric devices such as transformers and power cables, the reduction of alternating current (AC) loss for long wire is necessary. Multi-filamentation process, which is one of the most effective approaches for AC loss reduction, has been developed by the scribing process. We have developed the filamentation process using chemical etching. MOD derived CCs are, however, easily damaged in the chemical etching process due to existence of pores in a YBCO layer, resulting in critical current (Ic)-degradation and weak delamination strength. Consequently, it is difficult to scribe MOD derived CCs into 1mm-wide filaments for long length using the chemical etching process. Accordingly, we have studied a scribing process using an excimer laser without chemical etching. We defined P' value in this study as a function of irradiated laser power [J] divided by processing speed[m/s]. We studied relationship between the P' value and the results of scribing. It was found that we could scribe the C.C. with a sufficient depth in the condition of large P' value. Furthermore, we found that the Ic was degraded with further increase of the P' value. A 5 mm wide short sample was divided into 10 filaments by the excimer laser scribing process at the P' of 9[J/(m/s)]. The sample revealed reduction of the hysteresis loss down to 1/10 which could be expected from a theoretical prediction using the numbers of the filaments. Ic-degradation was suppressed as 28%, which was smaller than that of the scribed sample using chemical etching (Ic degradation was 38%). Subsequently, we applied the technique to a 100m long YBCO CC. The hysteresis loss of the 100m long MOD derived CC was reduced down to 1/10 (1/the number of filaments) after the multi-filamentation.

  16. Fast pixelated sensors for radiation detection and imaging based on quantum confined structures in III/V semiconductors

    Science.gov (United States)

    Tortora, M.; Biasiol, G.; Cautero, G.; Menk, R. H.; Plaisier, J. R.; Antonelli, M.

    2017-03-01

    In order to improve the characterisation of the delivered beams in many types of photon sources, innovative beam profilers based on III/V semiconductor materials (InGaAs/InAlAs) have been deeply investigated. Owing to a tunable and direct band gap these devices allow radiation detection in a wide spectral range. In order to increase the sensitivity of the device in radiation detection charge amplification on the sensor level is implemented. This is obtained by exploiting In0.75Ga0.25As/In0.75Al0.25As quantum wells (QW) hosting a two-dimensional electron gas (2DEG) through molecular beam epitaxy (MBE). Internal charge-amplification mechanism can be achieved for very low applied voltages, while the high carrier mobility allows the design of very fast photon detectors with sub-nanosecond response times. This technology has been preliminarily exploited to fabricate prototype beam profilers with a strip geometry (with 50-μm-wide strips). Tests were carried out both with conventional X-ray tubes and at the Elettra synchrotron facility. The results testify how these profilers are capable of reconstructing the shape of the beam, as well as estimating the position of the beam centroid with a precision of about 400 nm. Further measurements with different samples of decreasing thickness have shown how this precision could be further improved by an optimised microfabrication. For this reason a new design, based on a membrane-photodetector, is proposed. Results regarding the spatial resolution as function of the sensor thickness will be presented and discussed.

  17. Pixel detectors

    CERN Document Server

    Passmore, M S

    2001-01-01

    positions on the detector. The loss of secondary electrons follows the profile of the detector and increases with higher energy ions. studies of the spatial resolution predict a value of 5.3 lp/mm. The image noise in photon counting systems is investigated theoretically and experimentally and is shown to be given by Poisson statistics. The rate capability of the LAD1 was measured to be 250 kHz per pixel. Theoretical and experimental studies of the difference in contrast for ideal charge integrating and photon counting imaging systems were carried out. It is shown that the contrast differs and that for the conventional definition (contrast = (background - signal)/background) the photon counting device will, in some cases, always give a better contrast than the integrating system. Simulations in MEDICI are combined with analytical calculations to investigate charge collection efficiencies (CCE) in semiconductor detectors. Different pixel sizes and biasing conditions are considered. The results show charge shari...

  18. Charged particle detection performances of CMOS pixel sensors produced in a 0.18 μm process with a high resistivity epitaxial layer

    Science.gov (United States)

    Senyukov, S.; Baudot, J.; Besson, A.; Claus, G.; Cousin, L.; Dorokhov, A.; Dulinski, W.; Goffe, M.; Hu-Guo, C.; Winter, M.

    2013-12-01

    The apparatus of the ALICE experiment at CERN will be upgraded in 2017/18 during the second long shutdown of the LHC (LS2). A major motivation for this upgrade is to extend the physics reach for charmed and beauty particles down to low transverse momenta. This requires a substantial improvement of the spatial resolution and the data rate capability of the ALICE Inner Tracking System (ITS). To achieve this goal, the new ITS will be equipped with 50 μm thin CMOS Pixel Sensors (CPS) covering either the three innermost layers or all the 7 layers of the detector. The CPS being developed for the ITS upgrade at IPHC (Strasbourg) is derived from the MIMOSA 28 sensor realised for the STAR-PXL at RHIC in a 0.35 μm CMOS process. In order to satisfy the ITS upgrade requirements in terms of readout speed and radiation tolerance, a CMOS process with a reduced feature size and a high resistivity epitaxial layer should be exploited. In this respect, the charged particle detection performance and radiation hardness of the TowerJazz 0.18 μm CMOS process were studied with the help of the first prototype chip MIMOSA 32. The beam tests performed with negative pions of 120 GeV/c at the CERN-SPS allowed to measure a signal-to-noise ratio (SNR) for the non-irradiated chip in the range between 22 and 32 depending on the pixel design. The chip irradiated with the combined dose of 1 MRad and 1013neq /cm2 was observed to yield an SNR ranging between 11 and 23 for coolant temperatures varying from 15 °C to 30 °C. These SNR values were measured to result in particle detection efficiencies above 99.5% and 98% before and after irradiation, respectively. These satisfactory results allow to validate the TowerJazz 0.18 μm CMOS process for the ALICE ITS upgrade.

  19. Charged particle detection performances of CMOS pixel sensors produced in a 0.18μm process with a high resistivity epitaxial layer

    Energy Technology Data Exchange (ETDEWEB)

    Senyukov, S., E-mail: serhiy.senyukov@cern.ch; Baudot, J.; Besson, A.; Claus, G.; Cousin, L.; Dorokhov, A.; Dulinski, W.; Goffe, M.; Hu-Guo, C.; Winter, M.

    2013-12-01

    The apparatus of the ALICE experiment at CERN will be upgraded in 2017/18 during the second long shutdown of the LHC (LS2). A major motivation for this upgrade is to extend the physics reach for charmed and beauty particles down to low transverse momenta. This requires a substantial improvement of the spatial resolution and the data rate capability of the ALICE Inner Tracking System (ITS). To achieve this goal, the new ITS will be equipped with 50μm thin CMOS Pixel Sensors (CPS) covering either the three innermost layers or all the 7 layers of the detector. The CPS being developed for the ITS upgrade at IPHC (Strasbourg) is derived from the MIMOSA 28 sensor realised for the STAR-PXL at RHIC in a 0.35μm CMOS process. In order to satisfy the ITS upgrade requirements in terms of readout speed and radiation tolerance, a CMOS process with a reduced feature size and a high resistivity epitaxial layer should be exploited. In this respect, the charged particle detection performance and radiation hardness of the TowerJazz0.18μm CMOS process were studied with the help of the first prototype chip MIMOSA 32. The beam tests performed with negative pions of 120 GeV/c at the CERN-SPS allowed to measure a signal-to-noise ratio (SNR) for the non-irradiated chip in the range between 22 and 32 depending on the pixel design. The chip irradiated with the combined dose of 1 MRad and 10{sup 13}n{sub eq}/cm{sup 2} was observed to yield an SNR ranging between 11 and 23 for coolant temperatures varying from 15 °C to 30 °C. These SNR values were measured to result in particle detection efficiencies above 99.5% and 98% before and after irradiation, respectively. These satisfactory results allow to validate the TowerJazz0.18μm CMOS process for the ALICE ITS upgrade.

  20. Calculation stellar detection limit for active pixel sensor%有源像素传感器恒星探测极限计算方法

    Institute of Scientific and Technical Information of China (English)

    张晨; 沈绪榜; 陈朝阳

    2005-01-01

    恒星探测极限是星跟踪器的一个关键参数,在导航星库的建立和星图识别过程中起着重要作用.根据恒星辐射模型和CMOS有源像素传感器的噪声计算模型,提出了一种在给定信噪比和有源像素传感器噪声条件下,计算星跟踪器恒星探测极限的方法.该方法利用单位时间内、单位面积上有源像素传感器对0星等恒星的响应来求取恒星探测极限.最后,在信噪比为8的条件下,结合星跟踪器的有关参数给出了一个计算恒星探测极限的具体实例.%The stellar detection limit(SDL) of image sensor is a key parameter of star tracker. It plays an important role in the selection of guide stars and the star pattern identification. In order to calculate the SDL of CMOS active pixel sensor (APS), the model of star influx and the noise model of APS are presented. The main noise sources of APS are analyzed. If SNR and total noise of APS are given, the SDL of APS can be calculated based on the typical response of 0 magnitude visual star per second per mm2. As an example, a specific SDL of APS is provided with given optical parameters and exposure time.

  1. Achieving subpixel resolution with time-correlated transient signals in pixelated CdZnTe gamma-ray sensors using a focused laser beam (Conference Presentation)

    Science.gov (United States)

    Ocampo Giraldo, Luis A.; Bolotnikov, Aleksey E.; Camarda, Giuseppe S.; Cui, Yonggang; De Geronimo, Gianluigi; Gul, Rubi; Fried, Jack; Hossain, Anwar; Unlu, Kenan; Vernon, Emerson; Yang, Ge; James, Ralph B.

    2017-05-01

    High-resolution position-sensitive detectors have been proposed to correct response non-uniformities in Cadmium Zinc Telluride (CZT) crystals by virtually subdividing the detectors area into small voxels and equalizing responses from each voxel. 3D pixelated detectors coupled with multichannel readout electronics are the most advanced type of CZT devices offering many options in signal processing and enhancing detector performance. One recent innovation proposed for pixelated detectors is to use the induced (transient) signals from neighboring pixels to achieve high sub-pixel position resolution while keeping large pixel sizes. The main hurdle in achieving this goal is the relatively low signal induced on the neighboring pixels because of the electrostatic shielding effect caused by the collecting pixel. In addition, to achieve high position sensitivity one should rely on time-correlated transient signals, which means that digitized output signals must be used. We present the results of our studies to measure the amplitude of the pixel signals so that these can be used to measure positions of the interaction points. This is done with the processing of digitized correlated time signals measured from several adjacent pixels taking into account rise-time and charge-sharing effects. In these measurements we used a focused pulsed laser to generate a 10-micron beam at one milliwatt (650-nm wavelength) over the detector surface while the collecting pixel was moved in cardinal directions. The results include measurements that present the benefits of combining conventional pixel geometry with digital pulse processing for the best approach in achieving sub-pixel position resolution with the pixel dimensions of approximately 2 mm. We also present the sub-pixel resolution measurements at comparable energies from various gamma emitting isotopes.

  2. Comparison of relevant parameters of multi-pixel sensors for tracker detectors after irradiation with high proton and neutron fluences; Vergleich relevanter Parameter von Multipixelsensoren fuer Spurdetektoren nach Bestrahlung mit hohen Proton- und Neutronfluessen

    Energy Technology Data Exchange (ETDEWEB)

    Bergholz, Matthias

    2016-03-15

    The further increase of the luminosity of the Large Hadron Collider (LHC) at CERN requires new sensors for the tracking detector of the Compact Muon Soleniod (CMS) experiment. These sensors must be more radiation hard and of a finer granularity to lower the occupancy. In addition the new sensor modules must have a lower material budget and have to be self triggering. Sensor prototypes, the so called ''MPix''-sensors, produced on different materials were investigated for their radiation hardness. These sensors were fully characterized before and after irradiation. Of particular interest was the comparison of different bias methods, different materials and the influence of various geometries. The degeneration rate differs for the different sensor materials. The increase of the dark current of Float-Zone-Silicon is stronger for thicker sensors and less than for Magnetic-Czochralski-Silicon sensors. Both tested bias structures are damaged by the irradiation. The poly silicon resistance increases after irradiation by fifty percent. The Punch-Through-Structure is more effected by irradiation. The punch-through voltage increase by a factor of two. Due to the higher pixel current, the working point of the sensor is shifted to smaller differential resistances.

  3. ATLAS ITk Pixel detector

    CERN Document Server

    Gemme, Claudia; The ATLAS collaboration

    2016-01-01

    The high luminosity upgrade of the LHC (HL-LHC) in 2026 will provide new challenge to the ATLAS tracker. The current inner detector will be replaced with a whole silicon tracker which will consist of a five barrel layer Pixel detector surrounded by a four barrel layer Strip detector. The expected high radiation level are requiring the development of upgraded silicon sensors as well as new a front-end chip. The dense tracking environment will require finer granularity detectors. The data rates will require new technologies for high bandwidth data transmission and handling. The current status of the HL-LHC ATLA Pixel detector developments as well as the various layout options will be reviewed.

  4. Alpine Pixel Detector Layout

    CERN Document Server

    Delebecque, P; The ATLAS collaboration; Geffroy, N; Massol, N; Rambure, T; Todorov, T

    2013-01-01

    A description of an optimized layout of pixel sensors based on a stave that combines both barrel and endcap module orientations. The mechanical stiffness of the structure is provided by carbon fiber shells spaced by carbon foam. The cooling of the modules is provided by two-phase $CO_{2}$ flowing in a thin titanium pipe glued inside the carbon fiber foam. The electrical services of all modules are provided by a single stave flex. This layout eliminates the need for separate barrel and endcap detector structures, and therefore the barrel services material in front of the endcap. The transition from barrel to endcap module orientation is optimized separately for each layer in order to minimize the active pixel area and the traversed material. The sparse module spacing in the endcap part of the stave allows for multiple fixation points, and for a stiff overall structure composed only of staves interconnected by stiff disks.

  5. Digital Calorimetry Using Pixel Sensors

    NARCIS (Netherlands)

    Reicher, M.

    2016-01-01

    The subject of this thesis is a new type of electromagnetic calorimeter, which is not based on proportionality of deposited energy, but instead on counting the number of showering particles. This calorimeter is a proof of principle for a proposed upgrade of the ALICE experiment at the Large Hadron C

  6. Research and Development of Monolithic Active Pixel Sensors for the Detection of the Elementary Particles; Recherche et developpement de capteurs actifs monolithiques CMOS pour la detection de particules elementaires

    Energy Technology Data Exchange (ETDEWEB)

    Li, Y

    2007-09-15

    In order to develop high spatial resolution and readout speed vertex detectors for the future International Linear Collider (ILC), fast CMOS Monolithic Active Pixel Sensors (MAPS) are studied on this work. Two prototypes of MAPS, MIMOSA 8 and MIMOSA 16, based on the same micro-electronic architecture were developed in CMOS processes with different thickness of epitaxial layer. The size of pixel matrix is 32 x 128: 8 columns of the pixel array are readout directly with analog outputs and the other 24 columns are connected to the column level auto-zero discriminators. The Correlated Double Sampling (CDS) structures are successfully implemented inside pixel and discriminator. The photo diode type pixels with different diode sizes are used in these prototypes. With a {sup 55}Fe X-ray radioactive source, the important parameters, such as Temporal Noise, Fixed Pattern Noise (FPN), Signal-to-Noise Ratio (SNR), Charge-to-Voltage conversion Factor (CVF) and Charge Collection Efficiency (CCE), are studied as function of readout speed and diode size. For MIMOSA 8, the effect of fast neutrons irradiation is also. Two beam tests campaigns were made: at DESY with a 5 GeV electrons beam and at CERN with a 180 GeV pions beam. Detection Efficiency and Spatial Resolution are studied in function of the discriminator threshold. For these two parameters, the influences of diode size and SNR of the central pixel of a cluster are also discussed. In order to improve the spatial resolution of the digital outputs, a very compact (25 {mu}m x 1 mm) and low consumption (300 {mu}W) column level ADC is designed in AMS 0.35 {mu}m OPTO process. Based on successive approximation architecture, the auto-offset cancellation structure is integrated. A new column level auto-zero discriminator using static latch is also designed. (author)

  7. Development of SOI pixel detector in Cracow

    CERN Document Server

    Bugiel, Szymon; Glab, Sebastian; Idzik, Marek; Moron, Jakub; Kapusta, Piotr Julian; Kucewicz, Wojciech; Turala, Michal

    2015-01-01

    This paper presents the design of a new monolithic Silicon-On-Insulator pixel sensor in $200~nm$ SOI CMOS technology. The main application of the proposed pixel detector is the spectroscopy, but it can also be used for the minimum ionizing particle (MIP) tracking in particle physics experiments. For this reason few different versions of pixel cells are developed: a source-follower based pixel for tracking, a low noise pixel with preamplifier for spectroscopy, and a self-triggering pixel for time and amplitude measurements. In addition the design of a Successive Approximation Register Analog-to-Digital Converter (SAR ADC) is also presented. A 10-bit SAR ADC is developed for spectroscopic measurements and a lower resolution 6-bit SAR ADC is integrated in the pixel matrix as a column ADC, for tracking applications.

  8. Pixel readout chip for the ATLAS experiment

    CERN Document Server

    Ackers, M; Blanquart, L; Bonzom, V; Comes, G; Fischer, P; Keil, M; Kühl, T; Meuser, S; Delpierre, P A; Treis, J; Raith, B A; Wermes, N

    1999-01-01

    Pixel detectors with a high granularity and a very large number of sensitive elements (cells) are a very recent development used for high precision particle detection. At the Large Hadron Collider LHC at CERN (Geneva) a pixel detector with 1.4*10/sup 8/ individual pixel cells is developed for the ATLAS detector. The concept is a hybrid detector. Consisting of a pixel sensor connected to a pixel electronics chip by bump and flip chip technology in one-to-one cell correspondence. The development and prototype results of the pixel front end chip are presented together with the physical and technical requirements to be met at LHC. Lab measurements are reported. (6 refs).

  9. Diamond pixel modules

    CERN Document Server

    Gan, K K; Robichaud, A; Potenza, R; Kuleshov, S; Kagan, H; Kass, R; Wermes, N; Dulinski, W; Eremin, V; Smith, S; Sopko, B; Olivero, P; Gorisek, A; Chren, D; Kramberger, G; Schnetzer, S; Weilhammer, P; Martemyanov, A; Hugging, F; Pernegger, H; Lagomarsino, S; Manfredotti, C; Mishina, M; Trischuk, W; Dobos, D; Cindro, V; Belyaev, V; Duris, J; Claus, G; Wallny, R; Furgeri, A; Tuve, C; Goldstein, J; Sciortino, S; Sutera, C; Asner, D; Mikuz, M; Lo Giudice, A; Velthuis, J; Hits, D; Griesmayer, E; Oakham, G; Frais-Kolbl, H; Bellini, V; D'Alessandro, R; Cristinziani, M; Barbero, M; Schaffner, D; Costa, S; Goffe, M; La Rosa, A; Bruzzi, M; Schreiner, T; de Boer, W; Parrini, G; Roe, S; Randrianarivony, K; Dolenc, I; Moss, J; Brom, J M; Golubev, A; Mathes, M; Eusebi, R; Grigoriev, E; Tsung, J W; Mueller, S; Mandic, I; Stone, R; Menichelli, D

    2011-01-01

    With the commissioning of the LHC in 2010 and upgrades expected in 2015, ATLAS and CMS are planning to upgrade their innermost tracking layers with radiation hard technologies. Chemical Vapor Deposition diamond has been used extensively in beam conditions monitors as the innermost detectors in the highest radiation areas of BaBar, Belle, CDF and all LHC experiments. This material is now being considered as a sensor material for use very close to the interaction region where the most extreme radiation conditions exist Recently the RD42 collaboration constructed, irradiated and tested polycrystalline and single-crystal chemical vapor deposition diamond sensors to the highest fluences expected at the super-LHC. We present beam test results of chemical vapor deposition diamond up to fluences of 1.8 x 10(16) protons/cm(2) illustrating that both polycrystalline and single-crystal chemical vapor deposition diamonds follow a single damage curve. We also present beam test results of irradiated complete diamond pixel m...

  10. TFA Tank Focus Area - multiyear program plan FY98-FY00

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    1997-09-01

    The U.S. Department of Energy (DOE) continues to face a major radioactive waste tank remediation problem with hundreds of waste tanks containing hundreds of thousands of cubic meters of high-level waste (HLW) and transuranic (TRU) waste across the DOE complex. Approximately 80 tanks are known or assumed to have leaked. Some of the tank contents have reacted to form flammable gases, introducing additional safety risks. These tanks must be maintained in a safe condition and eventually remediated to minimize the risk of waste migration and/or exposure to workers, the public, and the environment. However, programmatic drivers are more ambitious than baseline technologies and budgets will support. Science and technology development investments are required to reduce the technical and programmatic risks associated with the tank remediation baselines. The Tanks Focus Area (TFA) was initiated in 1994 to serve as the DOE`s Office of Environmental Management`s (EM`s) national technology development program for radioactive waste tank remediation. The national program was formed to increase integration and realize greater benefits from DOE`s technology development budget. The TFA is responsible for managing, coordinating, and leveraging technology development to support DOE`s four major tank sites: Hanford Site (Washington), Idaho National Engineering and Environmental Laboratory (INEEL) (Idaho), Oak Ridge Reservation (ORR) (Tennessee), and Savannah River Site (SRS) (South Carolina). Its technical scope covers the major functions that comprise a complete tank remediation system: waste retrieval, waste pretreatment, waste immobilization, tank closure, and characterization of both the waste and tank with safety integrated into all the functions. The TFA integrates program activities across organizations that fund tank technology development EM, including the Offices of Waste Management (EM-30), Environmental Restoration (EM-40), and Science and Technology (EM-50).

  11. TFA Tanks Focus Area Multiyear Program Plan FY00-FY04

    Energy Technology Data Exchange (ETDEWEB)

    BA Carteret; JH Westsik; LR Roeder-Smith; RL Gilchrist; RW Allen; SN Schlahta; TM Brouns

    1999-10-12

    The U.S. Department of Energy (DOE) continues to face a major radioactive waste tank remediation problem with hundreds of waste tanks containing hundreds of thousands of cubic meters of high-level waste (HLW) and transuranic (TRU) waste across the DOE complex. Approximately 68 tanks are known or assumed to have leaked contamination to the soil. Some of the tank contents have reacted to form flammable gases, introducing additional safety risks. These tanks must be maintained in a safe condition and eventually remediated to minimize the risk of waste migration and/or exposure to workers, the public, and the environment. However, programmatic drivers are more ambitious than baseline technologies and budgets will support. Science and technology development investments are required to reduce the technical and programmatic risks associated with the tank remediation baselines. The Tanks Focus Area (TFA) was initiated in 1994 to serve as the DOE Office of Environmental Management's (EM's) national technology development program. for radioactive waste tank remediation. The national program was formed to increase integration and realize greater benefits from DOE's technology development budget. The TFA is responsible for managing, coordinating, and leveraging technology development to support DOE's five major tank sites: Hanford Site (Washington), Idaho National Engineering and Environmental Laboratory (INEEL) (Idaho), Oak Ridge Reservation (ORR) (Tennessee), Savannah River Site (SRS) (South Carolina), and West Valley Demonstration Project (WVDP) (New York). Its technical scope covers the major functions that comprise a complete tank remediation system: waste retrieval, waste pretreatment, waste immobilization, tank closure, and characterization of both the waste and tank with safety integrated into all the functions. The TFA integrates program activities across EM organizations that fund tank technology development, including the Offices of Waste

  12. Design and TCAD simulation of planar p-on-n active-edge pixel sensors for the next generation of FELs

    Energy Technology Data Exchange (ETDEWEB)

    Dalla Betta, G.-F., E-mail: gianfranco.dallabetta@unitn.it [Università di Trento, Dipartimento di Ingegneria Industriale, I-38123 Trento (Italy); TIFPA INFN, I-38123 Trento (Italy); Batignani, G. [Università di Pisa, Dipartimento di Fisica, I-56127 Pisa (Italy); INFN, Sezione di Pisa, I-56127 Pisa (Italy); Benkechkache, M.A. [TIFPA INFN, I-38123 Trento (Italy); University Constantine 1, Department of Electronics in the Science and Technology Faculty, I-25017 Constantine (Algeria); Bettarini, S.; Casarosa, G. [Università di Pisa, Dipartimento di Fisica, I-56127 Pisa (Italy); INFN, Sezione di Pisa, I-56127 Pisa (Italy); Comotti, D. [Università di Pavia, Dipartimento di Ingegneria Industriale e dell' Informazione, I-27100 Pavia (Italy); INFN Sezione di Pavia, I-27100 Pavia (Italy); Fabris, L. [INFN Sezione di Pavia, I-27100 Pavia (Italy); Università di Bergamo, Dipartimento di Ingegneria e Scienze Applicate, I-24044 Dalmine (Italy); Forti, F. [Università di Pisa, Dipartimento di Fisica, I-56127 Pisa (Italy); INFN, Sezione di Pisa, I-56127 Pisa (Italy); Grassi, M. [Università di Pavia, Dipartimento di Ingegneria Industriale e dell' Informazione, I-27100 Pavia (Italy); INFN Sezione di Pavia, I-27100 Pavia (Italy); Latreche, S. [University Constantine 1, Department of Electronics in the Science and Technology Faculty, I-25017 Constantine (Algeria); Lodola, L.; Malcovati, P. [Università di Pavia, Dipartimento di Ingegneria Industriale e dell' Informazione, I-27100 Pavia (Italy); INFN Sezione di Pavia, I-27100 Pavia (Italy); Manghisoni, M. [INFN Sezione di Pavia, I-27100 Pavia (Italy); Università di Bergamo, Dipartimento di Ingegneria e Scienze Applicate, I-24044 Dalmine (Italy); and others

    2016-07-11

    We report on the design and TCAD simulations of planar p-on-n sensors with active edge aimed at a four-side buttable X-ray detector module for future FEL applications. Edge terminations with different number of guard rings were designed to find the best trade-off between breakdown voltage and border gap size. The methodology of the sensor design, the optimization of the most relevant parameters to maximize the breakdown voltage and the final layout are described.

  13. Design and TCAD simulation of planar p-on-n active-edge pixel sensors for the next generation of FELs

    Science.gov (United States)

    Dalla Betta, G.-F.; Batignani, G.; Benkechkache, M. A.; Bettarini, S.; Casarosa, G.; Comotti, D.; Fabris, L.; Forti, F.; Grassi, M.; Latreche, S.; Lodola, L.; Malcovati, P.; Manghisoni, M.; Mendicino, R.; Morsani, F.; Paladino, A.; Pancheri, L.; Paoloni, E.; Ratti, L.; Re, V.; Rizzo, G.; Traversi, G.; Vacchi, C.; Verzellesi, G.; Xu, H.

    2016-07-01

    We report on the design and TCAD simulations of planar p-on-n sensors with active edge aimed at a four-side buttable X-ray detector module for future FEL applications. Edge terminations with different number of guard rings were designed to find the best trade-off between breakdown voltage and border gap size. The methodology of the sensor design, the optimization of the most relevant parameters to maximize the breakdown voltage and the final layout are described.

  14. Questionnaire for Persons with a Transfemoral Amputation (Q-TFA): initial validity and reliability of a new outcome measure.

    Science.gov (United States)

    Hagberg, Kerstin; Brånemark, Rickard; Hägg, Olle

    2004-09-01

    The Questionnaire for Persons with a Transfemoral Amputation (Q-TFA) is a new self-report measure developed for nonelderly transfemoral amputees using a socket- or osseointegrated prosthesis to reflect use, mobility, problems, and global health, each in a separate score (0-100). This paper describes the initial measurement properties of the Q-TFA as completed by 156 persons with a transfemoral amputation using a socket prosthesis (67% male, 92% nonvascular cases, mean age 51 years). Criterion validity was determined by associations between scores of the Q-TFA and the Short-Form 36 (SF-36)-Item Health Survey. Reliability was assessed by retest (n = 48) and by determination of the internal consistency. Correlations between Q-TFA and SF-36-Item Health Survey scales matched hypothesized patterns. Intraclass correlations were between 0.89 and 0.97, and measurement error ranged from 10 to 19 points. Cronbach's alpha revealed good internal consistency, with no values less than 0.7. This study shows that the Q-TFA, applied to persons using a transfemoral socket prosthesis, has adequate initial validity and reliability.

  15. Isolation of bacterial plasmids by density gradient centrifugation in cesium trifluoroacetate (CsTFA) without the use of ethidium bromide.

    Science.gov (United States)

    Andersson, K; Hjorth, R

    1985-01-01

    Plasmids extracted from bacterial cells by alkaline extraction can easily be isolated from linear DNA by isopycnic centrifugation in CsTFA. This is a fast and simple method which circumvents the use of the intercalating dye, ethidium bromide, and consequently the problems associated with its removal. The buoyant densities for covalently closed circular DNA and linear DNA in CsTFA are 1.60 g/ml and 1.65 g/ml, respectively. The isolation is achieved regardless of plasmid size and can be accomplished at temperatures of between 4 and 30 degrees C. Plasmid DNA isolated in gradients of CsTFA are of a high purity and have been found to be intact when cleaved with restriction enzymes and ligated with T4 DNA ligase.

  16. Production chain of CMS pixel modules

    CERN Document Server

    2006-01-01

    The pictures show the production chain of pixel modules for the CMS detector. Fig.1: overview of the assembly procedure. Fig.2: bump bonding with ReadOut Chip (ROC) connected to the sensor. Fig.3: glueing a raw module onto the baseplate strips. Fig.4: glueing of the High Density Interconnect (HDI) onto a raw module. Fig.5: pull test after heat reflow. Fig.6: wafer sensor processing, Indium evaporation.

  17. A Novel Sensor Based on a Single-Pixel Microwave Radiometer for Warm Object Counting: Concept Validation and IoT Perspectives

    Directory of Open Access Journals (Sweden)

    Federico Alimenti

    2017-06-01

    Full Text Available Controlled measurements by a low-cost single-pixel microwave radiometer operating at 12.65 GHz were carried out to assess the detection and counting capability for targets warmer than the surroundings. The adopted reference test targets were pre-warmed water and oil; and a hand, both naked and wearing a glove. The results showed the reliability of microwave radiometry for counting operations under controlled conditions, and its effectiveness at detecting even warm targets masked by unheated dielectric layers. An electromagnetic model describing the scenario sensed by the radiometer antenna is proposed, and comparison with the experimental observations shows a good agreement. The measurements prove that reliable counting is enabled by an antenna temperature increment, for each target sample added, of around 1 K. Starting from this value, an analysis of the antenna filling factor was performed to provide an instrument useful for evaluating real applicability in many practical situations. This study also allows the direct people counting problem to be addressed, providing preliminary operational indications, reference numbers and experimental validation.

  18. A Novel Sensor Based on a Single-Pixel Microwave Radiometer for Warm Object Counting: Concept Validation and IoT Perspectives.

    Science.gov (United States)

    Alimenti, Federico; Bonafoni, Stefania; Roselli, Luca

    2017-06-14

    Controlled measurements by a low-cost single-pixel microwave radiometer operating at 12.65 GHz were carried out to assess the detection and counting capability for targets warmer than the surroundings. The adopted reference test targets were pre-warmed water and oil; and a hand, both naked and wearing a glove. The results showed the reliability of microwave radiometry for counting operations under controlled conditions, and its effectiveness at detecting even warm targets masked by unheated dielectric layers. An electromagnetic model describing the scenario sensed by the radiometer antenna is proposed, and comparison with the experimental observations shows a good agreement. The measurements prove that reliable counting is enabled by an antenna temperature increment, for each target sample added, of around 1 K. Starting from this value, an analysis of the antenna filling factor was performed to provide an instrument useful for evaluating real applicability in many practical situations. This study also allows the direct people counting problem to be addressed, providing preliminary operational indications, reference numbers and experimental validation.

  19. It's not the pixel count, you fool

    Science.gov (United States)

    Kriss, Michael A.

    2012-01-01

    The first thing a "marketing guy" asks the digital camera engineer is "how many pixels does it have, for we need as many mega pixels as possible since the other guys are killing us with their "umpteen" mega pixel pocket sized digital cameras. And so it goes until the pixels get smaller and smaller in order to inflate the pixel count in the never-ending pixel-wars. These small pixels just are not very good. The truth of the matter is that the most important feature of digital cameras in the last five years is the automatic motion control to stabilize the image on the sensor along with some very sophisticated image processing. All the rest has been hype and some "cool" design. What is the future for digital imaging and what will drive growth of camera sales (not counting the cell phone cameras which totally dominate the market in terms of camera sales) and more importantly after sales profits? Well sit in on the Dark Side of Color and find out what is being done to increase the after sales profits and don't be surprised if has been done long ago in some basement lab of a photographic company and of course, before its time.

  20. Irradiation and beam tests qualification for ATLAS IBL Pixel Modules.

    CERN Document Server

    Rubinskiy, Igor; The ATLAS collaboration

    2011-01-01

    The upgrade for the ATLAS detector will undergo different phases towards HL-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (foreseen for 2013-14). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.2 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reduction of the pixel size and of the material budget. Two different promising Silicon sensor technologies (Planar n-in-n and 3D) are currently under investigation for the pixel detector. An overview of the sensor technologies qualification with particular emphasis on irradiation and beam tests will be presented.

  1. Irradiation and beam tests qualification for ATLAS IBL Pixel Modules

    CERN Document Server

    Rubinskiy, I

    2013-01-01

    The upgrade for the ATLAS detector will have different steps towards HL-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (foreseen for 2013–2014). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing Pixel Detector and a new (smaller radius) beam-pipe at a radius of 33 mm. The IBL will require the development of several new technologies to cope with the increase in the radiation damage and the pixel occupancy and also to improve the physics performance, which will be achieved by reduction of the pixel size and of the material budget. Two different promising silicon sensor technologies (Planar n-in-n and 3D) are currently under investigation for the Pixel Detector. An overview of the sensor technologies' qualification with particular emphasis on irradiation and beam tests is presented.

  2. Irradiation and beam tests qualification for ATLAS IBL Pixel Modules

    CERN Document Server

    Rubinskiy, Igor

    2013-01-01

    The upgrade for the ATLAS detector will have different steps towards HL-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (foreseen for 2013-14). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 33 mm. The IBL will require the development of several new technologies to cope with the increase of the radiation damage and the pixel occupancy and also to improve the physics performance, which will be achieved by reduction of the pixel size and of the material budget. Two different promising silicon sensor technologies (Planar n-in-n and 3D) are currently under investigation for the pixel detector. An overview of the sensor technologies’ qualification with particular emphasis on irradiation and beam tests are presented.

  3. Angle-sensitive pixel design for wavefront sensing

    CERN Document Server

    Zheng, Guoan

    2013-01-01

    Conventional image sensors are only responsive to the intensity variation of the incoming light wave. By encoding the wavefront information into the balanced detection scheme, we demonstrate an image sensor pixel design that is capable to detect both the local intensity and wavefront information simultaneously. With the full compatibility to the CMOS fabrication process, the proposed pixel design can benefit a variety of applications, including phase microscopy, lensless imaging and machine vision.

  4. HTS current lead units prepared by the TFA-MOD processed YBCO coated conductors

    Energy Technology Data Exchange (ETDEWEB)

    Shiohara, K.; Sakai, S.; Ishii, Y. [Tokai University, 1117 Kita-Kaname, Hiratsuka, Kanagawa 259-1292 (Japan); Yamada, Y., E-mail: yyamaday@keyaki.cc.u-tokai.ac.j [Tokai University, 1117 Kita-Kaname, Hiratsuka, Kanagawa 259-1292 (Japan); Tachikawa, K. [Tokai University, 1117 Kita-Kaname, Hiratsuka, Kanagawa 259-1292 (Japan); Koizumi, T.; Aoki, Y.; Hasegawa, T. [SWCC Showa Cable System Co., LTD, 4-1-1 Minami-Hashimoto, Sagamihara, Kanagawa 229-1133 (Japan); Tamura, H.; Mito, T. [NIFS National Institute for Fusion Science, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)

    2010-11-01

    Two superconducting current lead units have been prepared using ten coated conductors of the Tri-Fluoro-Acetate - Metal Organic Deposition (TFA-MOD) processed Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7-{delta}}(YBCO) coated conductors with critical current (I{sub c}) of about 170 A at 77 K in self-field. The coated conductors are 5 mm in width, 190 mm in length and about 120 {mu}m in overall thickness. The 1.5 {mu}m thick superconducting YBCO layer was synthesized through the TFA-MOD process on Hastelloy{sup TM} C-276 substrate tape with two buffer oxide layers of Gd{sub 2}Zr{sub 2}O{sub 7} and CeO{sub 2}. The five YBCO coated conductors are attached on a 1 mm thick Glass Fiber Reinforced Plastics (GFRP) board and soldered to Cu caps at the both ends. We prepared two 500 A-class current lead units. The DC transport current of 800 A was stably applied at 77 K without any voltage generation in all coated conductors. The voltage between both Cu caps linearly increased with increasing the applied current, and was about 350 {mu}V at 500 A in both current lead units. According to the estimated values of the heat leakage from 77 K to 4.2 K, the heat leakage for the current lead unit was 46.5 mW. We successfully attained reduction of the heat leakage because of improvement of the transport current performance (I{sub c}), a thinner Ag layer of YBCO coated conductor and usage of the GFRP board for reinforcement instead of a stainless steel board used in the previous study. The DC transport current of 1400 A was stably applied when the two current lead units were joined in parallel. The sum of the heat leakages from 77 K to 4.2 K for the combined the current lead units was 93 mW. In comparison with the conventional Cu current leads by gas-cooling, it could be noted that the heat leakage of the current lead is about one order of magnitude smaller than that of the Cu current lead.

  5. The pixelated detector

    CERN Multimedia

    Sutton, C

    1990-01-01

    "Collecting data as patterns of light or subatomic particles is vitally important in all the sciences. The new generation of solid-state detectors called pixel devices could transform experimental research at all levels" (4 pages).

  6. Hit efficiency study of CMS prototype forward pixel detectors

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Dongwook; /Johns Hopkins U.

    2006-01-01

    In this paper the author describes the measurement of the hit efficiency of a prototype pixel device for the CMS forward pixel detector. These pixel detectors were FM type sensors with PSI46V1 chip readout. The data were taken with the 120 GeV proton beam at Fermilab during the period of December 2004 to February 2005. The detectors proved to be highly efficient (99.27 {+-} 0.02%). The inefficiency was primarily located near the corners of the individual pixels.

  7. Comparative studies of cutins from lime (Citrus aurantifolia) and grapefruit (Citrus paradisi) after TFA hydrolysis.

    Science.gov (United States)

    Hernández Velasco, Brenda Liliana; Arrieta-Baez, Daniel; Cortez Sotelo, Pedro Iván; Méndez-Méndez, Juan Vicente; Berdeja Martínez, Blanca Margarita; Gómez-Patiño, Mayra Beatriz

    2017-09-09

    Grapefruit and lime cutins were analyzed and compared in order to obtain information about their cutin architecture. This was performed using a sequential hydrolysis, first with trifluoroacetic acid to remove most of the polysaccharides present in the cutins, followed by an alkaline hydrolysis in order to obtain the main aliphatic compounds. Analysis by CPMAS (13)C NMR and ATR FT-IR of the cutins after 2.0 M TFA revealed that grapefruit cutin has independent aliphatic and polysaccharide domains while in the lime cutin these components could be homogeneously distributed. These observations were in agreement with an AFM analysis of the cutins obtained in the hydrolysis reactions. The main aliphatic compounds were detected and characterized as 16-hydroxy-10-oxo-hexadecanoic acid and 10,16-dihydroxyhexadecanoic acid. These were present in grapefruit cutin at 35.80% and 21.86% and in lime cutin at 20.44% and 40.36% respectively. Copyright © 2017 Elsevier Ltd. All rights reserved.

  8. The humidity effect of YBCO film by TFA-MOD process

    Energy Technology Data Exchange (ETDEWEB)

    Jang, Seok Hern; Lim, Jun Hyung; Yoon, Kyung Min; Lee, Seung Yi; Kim, Kyu Tae; Lee, Chnag Min; Joo, Jin Ho; Nah, Wan Soo [Sungkyunkwan University, Suwon (Korea, Republic of); Lee, Hee Gyoun; Hong, Gye Won [Dept. of Electronic Engineering, Korea Polytechnic Univesity, Siheung (Korea, Republic of)

    2006-10-15

    We fabricated YBa{sub 2}Cu{sub 3}3O{sub 7-x} (YBCO) films on(00l) LaAlO{sub 3} substrates prepared by metal organic deposition(MOD) method using trifluoroacetate(TFA) solution and evaluated the effects of the humidity on the microstructure, phase purity, and critical properties. The films calcined at 430 degrees C were fired at 775 degrees C at 0%, 4.2%, 12.1%, and 20.0% humidified As gas mixed with 0.1% O{sub 2}. We observed that the amount of BaF{sub 2} phase was effectively reduced and that a sharp and strong biaxial texture formed under a humidified atmosphere, leading to increased critical properties. For the films fired at 0% humidity, the T{sub c} and I{sub c} were undetectably small. When the humidity was increased to 4.2%, the corresponding T{sub c}(onset) and I{sub c} were increased to 90.5 K and 8 A/cm-width, respectively. For the films at the humidity range of 12.1-20.0%, the I{sub c} was found to be 35 A/cm-width. According to the results of the XRD, pole-figure, and SEM, these improved critical properties are probably attributed to the formation of a purer YBCO phase, larger grain size, and stronger c-axis orientation.

  9. Proceedings of PIXEL98 -- International pixel detector workshop

    Energy Technology Data Exchange (ETDEWEB)

    Anderson, D.F.; Kwan, S. [eds.

    1998-08-01

    Experiments around the globe face new challenges of more precision in the face of higher interaction rates, greater track densities, and higher radiation doses, as they look for rarer and rarer processes, leading many to incorporate pixelated solid-state detectors into their plans. The highest-readout rate devices require new technologies for implementation. This workshop reviewed recent, significant progress in meeting these technical challenges. Participants presented many new results; many of them from the weeks--even days--just before the workshop. Brand new at this workshop were results on cryogenic operation of radiation-damaged silicon detectors (dubbed the Lazarus effect). Other new work included a diamond sensor with 280-micron collection distance; new results on breakdown in p-type silicon detectors; testing of the latest versions of read-out chip and interconnection designs; and the radiation hardness of deep-submicron processes.

  10. Sensors

    Energy Technology Data Exchange (ETDEWEB)

    Jensen, H. [PBI-Dansensor A/S (Denmark); Toft Soerensen, O. [Risoe National Lab., Materials Research Dept. (Denmark)

    1999-10-01

    A new type of ceramic oxygen sensors based on semiconducting oxides was developed in this project. The advantage of these sensors compared to standard ZrO{sub 2} sensors is that they do not require a reference gas and that they can be produced in small sizes. The sensor design and the techniques developed for production of these sensors are judged suitable by the participating industry for a niche production of a new generation of oxygen sensors. Materials research on new oxygen ion conducting conductors both for applications in oxygen sensors and in fuel was also performed in this project and finally a new process was developed for fabrication of ceramic tubes by dip-coating. (EHS)

  11. Sensors

    CERN Document Server

    Pigorsch, Enrico

    1997-01-01

    This is the 5th edition of the Metra Martech Directory "EUROPEAN CENTRES OF EXPERTISE - SENSORS." The entries represent a survey of European sensors development. The new edition contains 425 detailed profiles of companies and research institutions in 22 countries. This is reflected in the diversity of sensors development programmes described, from sensors for physical parameters to biosensors and intelligent sensor systems. We do not claim that all European organisations developing sensors are included, but this is a good cross section from an invited list of participants. If you see gaps or omissions, or would like your organisation to be included, please send details. The data base invites the formation of effective joint ventures by identifying and providing access to specific areas in which organisations offer collaboration. This issue is recognised to be of great importance and most entrants include details of collaboration offered and sought. We hope the directory on Sensors will help you to find the ri...

  12. Neural network based cluster creation in the ATLAS Pixel Detector

    CERN Document Server

    Andreazza, A; The ATLAS collaboration

    2012-01-01

    The read-out from individual pixels on planar semi-conductor sensors are grouped into clusters to reconstruct the location where a charged particle passed through the sensor. The resolution given by individual pixel sizes is significantly improved by using the information from the charge sharing be- tween pixels. Such analog cluster creation techniques have been used by the ATLAS experiment for many years to obtain an excellent performance. How- ever, in dense environments, such as those inside high-energy jets, clusters have an increased probability of merging the charge deposited by multiple particles. Recently, a neural network based algorithm which estimates both the cluster position and whether a cluster should be split has been developed for the ATLAS Pixel Detector. The algorithm significantly reduces ambigui- ties in the assignment of pixel detector measurement to tracks and improves the position accuracy with respect to standard techniques by taking into account the 2-dimensional charge distribution.

  13. From Hybrid to CMOS Pixels ... a possibility for LHC's pixel future?

    CERN Document Server

    Wermes, Norbert

    2015-01-01

    Hybrid pixel detectors have been invented for the LHC to make tracking and vertexing possible at all in LHC's radiation intense environment. The LHC pixel detectors have meanwhile very successfully fulfilled their promises and R\\&D for the planned HL-LHC upgrade is in full swing, targeting even higher ionising doses and non-ionising fluences. In terms of rate and radiation tolerance hybrid pixels are unrivaled. But they have disadvantages as well, most notably material thickness, production complexity, and cost. Meanwhile also active pixel sensors (DEPFET, MAPS) have become real pixel detectors but they would by far not stand the rates and radiation faced from HL-LHC. New MAPS developments, so-called DMAPS (depleted MAPS) which are full CMOS-pixel structures with charge collection in a depleted region have come in the R\\&D focus for pixels at high rate/radiation levels. This goal can perhaps be realised exploiting HV technologies, high ohmic substrates and/or SOI based technologies. The paper covers t...

  14. The ALICE pixel detector upgrade

    Science.gov (United States)

    Reidt, F.

    2016-12-01

    The ALICE experiment at the CERN LHC is designed to study the physics of strongly interacting matter, and in particular the properties of the Quark-Gluon Plasma, using proton-proton, proton-nucleus and nucleus-nucleus collisions. The ALICE collaboration is preparing a major upgrade of the experimental apparatus to be installed during the second long LHC shutdown in the years 2019-2020. A key element of the ALICE upgrade is the new, ultra-light, high-resolution Inner Tracking System. With respect to the current detector, the new Inner Tracking System will significantly enhance the pointing resolution, the tracking efficiency at low transverse momenta, and the read-out rate capabilities. This will be obtained by seven concentric detector layers based on a Monolithic Active Pixel Sensor with a pixel pitch of about 30×30 μm2. A key feature of the new Inner Tracking System, which is optimised for high tracking accuracy at low transverse momenta, is the very low mass of the three innermost layers, which feature a material budget of 0.3% X0 per layer. This contribution presents the design goals and layout of the upgraded ALICE Inner Tracking System, summarises the R&D activities focussing on the technical implementation of the main detector components, and the projected detector performance.

  15. Développement d'un capteur de pixels CMOS pour les couches externes du détecteur de vertex ILC

    OpenAIRE

    Zhang, Liang

    2013-01-01

    This work deals with the design of a CMOS pixel sensor prototype (called MIMOSA 31) for the outer layers of the International Linear Collider (ILC) vertex detector. CMOS pixel sensors (CPS) also called monolithic active pixel sensors (MAPS) have demonstrated attractive performance towards the requirements of the vertex detector of the future linear collider. MIMOSA 31developed at IPHC-Strasbourg is the first pixel sensor integrated with 4-bit column-level ADC for the outer layers. It is compo...

  16. Aerobic dehydrogenation of cyclohexanone to cyclohexenone catalyzed by Pd(DMSO)2(TFA)2: evidence for ligand-controlled chemoselectivity.

    Science.gov (United States)

    Diao, Tianning; Pun, Doris; Stahl, Shannon S

    2013-06-05

    The dehydrogenation of cyclohexanones affords cyclohexenones or phenols via removal of 1 or 2 equiv of H2, respectively. We recently reported several Pd(II) catalyst systems that effect aerobic dehydrogenation of cyclohexanones with different product selectivities. Pd(DMSO)2(TFA)2 is unique in its high chemoselectivity for the conversion of cyclohexanones to cyclohexenones, without promoting subsequent dehydrogenation of cyclohexenones to phenols. Kinetic and mechanistic studies of these reactions reveal the key role of the dimethylsulfoxide (DMSO) ligand in controlling this chemoselectivity. DMSO has minimal kinetic influence on the rate of Pd(TFA)2-catalyzed dehydrogenation of cyclohexanone to cyclohexenone, while it strongly inhibits the second dehydrogenation step, conversion of cyclohexenone to phenol. These contrasting kinetic effects of DMSO provide the basis for chemoselective formation of cyclohexenones.

  17. Design methodology: edgeless 3D ASICs with complex in-pixel processing for pixel detectors

    Energy Technology Data Exchange (ETDEWEB)

    Fahim Farah, Fahim Farah [Northwestern U. (main); Deptuch, Grzegorz W. [Fermilab; Hoff, James R. [Fermilab; Mohseni, Hooman [Northwestern U. (main)

    2015-08-28

    The design methodology for the development of 3D integrated edgeless pixel detectors with in-pixel processing using Electronic Design Automation (EDA) tools is presented. A large area 3 tier 3D detector with one sensor layer and two ASIC layers containing one analog and one digital tier, is built for x-ray photon time of arrival measurement and imaging. A full custom analog pixel is 65μm x 65μm. It is connected to a sensor pixel of the same size on one side, and on the other side it has approximately 40 connections to the digital pixel. A 32 x 32 edgeless array without any peripheral functional blocks constitutes a sub-chip. The sub-chip is an indivisible unit, which is further arranged in a 6 x 6 array to create the entire 1.248cm x 1.248cm ASIC. Each chip has 720 bump-bond I/O connections, on the back of the digital tier to the ceramic PCB. All the analog tier power and biasing is conveyed through the digital tier from the PCB. The assembly has no peripheral functional blocks, and hence the active area extends to the edge of the detector. This was achieved by using a few flavors of almost identical analog pixels (minimal variation in layout) to allow for peripheral biasing blocks to be placed within pixels. The 1024 pixels within a digital sub-chip array have a variety of full custom, semi-custom and automated timing driven functional blocks placed together. The methodology uses a modified mixed-mode on-top digital implementation flow to not only harness the tool efficiency for timing and floor-planning but also to maintain designer control over compact parasitically aware layout. The methodology uses the Cadence design platform, however it is not limited to this tool.

  18. A germanium hybrid pixel detector with 55μm pixel size and 65,000 channels

    Science.gov (United States)

    Pennicard, D.; Struth, B.; Hirsemann, H.; Sarajlic, M.; Smoljanin, S.; Zuvic, M.; Lampert, M. O.; Fritzsch, T.; Rothermund, M.; Graafsma, H.

    2014-12-01

    Hybrid pixel semiconductor detectors provide high performance through a combination of direct detection, a relatively small pixel size, fast readout and sophisticated signal processing circuitry in each pixel. For X-ray detection above 20 keV, high-Z sensor layers rather than silicon are needed to achieve high quantum efficiency, but many high-Z materials such as GaAs and CdTe often suffer from poor material properties or nonuniformities. Germanium is available in large wafers of extremely high quality, making it an appealing option for high-performance hybrid pixel X-ray detectors, but suitable technologies for finely pixelating and bump-bonding germanium have not previously been available. A finely-pixelated germanium photodiode sensor with a 256 by 256 array of 55μm pixels has been produced. The sensor has an n-on-p structure, with 700μm thickness. Using a low-temperature indium bump process, this sensor has been bonded to the Medipix3RX photoncounting readout chip. Tests with the LAMBDA readout system have shown that the detector works successfully, with a high bond yield and higher image uniformity than comparable high-Z systems. During cooling, the system is functional around -80°C (with warmer temperatures resulting in excessive leakage current), with -100°C sufficient for good performance.

  19. Development of a high density pixel multichip module at Fermilab

    Energy Technology Data Exchange (ETDEWEB)

    Cardoso, G. [and others

    2001-03-08

    At Fermilab, both pixel detector multichip module and sensor hybridization are being developed for the BTeV experiment. The BTeV pixel detector is based on a design relying on a hybrid approach. With this approach, the readout chip and the sensor array are developed separately and the detector is constructed by flip-chip mating the two together. This method offers maximum flexibility in the development process, choice of fabrication technologies, and the choice of sensor material. This paper presents strategies to handle the required data rate and performance results of the first prototype and detector hybridization.

  20. Pixel detector insertion

    CERN Multimedia

    CMS

    2015-01-01

    Insertion of the Pixel Tracker, the 66-million-channel device used to pinpoint the vertex of each colliding proton pair, located at the heart of the detector. The geometry of CMS is a cylinder lying on its side (22 meters long and 15 meters high in dia

  1. Pixel detector readout chip

    CERN Multimedia

    1991-01-01

    Close-up of a pixel detector readout chip. The photograph shows an aera of 1 mm x 2 mm containing 12 separate readout channels. The entire chip contains 1000 readout channels (around 80 000 transistors) covering a sensitive area of 8 mm x 5 mm. The chip has been mounted on a silicon detector to detect high energy particles.

  2. ALICE Silicon Pixel Detector

    CERN Multimedia

    Manzari, V

    2013-01-01

    The Silicon Pixel Detector (SPD) forms the innermost two layers of the 6-layer barrel Inner Tracking System (ITS). The SPD plays a key role in the determination of the position of the primary collision and in the reconstruction of the secondary vertices from particle decays.

  3. Small-Scale Readout Systems Prototype for the STAR PIXEL Detector

    Energy Technology Data Exchange (ETDEWEB)

    Szelezniak, Michal A.; Besson, Auguste; Colledani, Claude; Dorokhov, Andrei; Dulinski, Wojciech; Greiner, Leo C.; Himmi, Abdelkader; Hu, Christine; Matis, Howard S.; Ritter, Hans Georg; Rose, Andrew; Shabetai, Alexandre; Stezelberger, Thorsten; Sun, Xiangming; Thomas, Jim H.; Valin, Isabelle; Vu, Chinh Q.; Wieman, Howard H.; Winter, Marc

    2008-10-01

    A prototype readout system for the STAR PIXEL detector in the Heavy Flavor Tracker (HFT) vertex detector upgrade is presented. The PIXEL detector is a Monolithic Active Pixel Sensor (MAPS) based silicon pixel vertex detector fabricated in a commercial CMOS process that integrates the detector and front-end electronics layers in one silicon die. Two generations ofMAPS prototypes designed specifically for the PIXEL are discussed. We have constructed a prototype telescope system consisting of three small MAPS sensors arranged in three parallel and coaxial planes with a readout system based on the readout architecture for PIXEL. This proposed readout architecture is simple and scales to the size required to readout the final detector. The real-time hit finding algorithm necessary for data rate reduction in the 400 million pixel detector is described, and aspects of the PIXEL system integration into the existing STAR framework are addressed. The complete system has been recently tested and shown to be fully functional.

  4. Hybrid Pixel Detectors for gamma/X-ray imaging

    Science.gov (United States)

    Hatzistratis, D.; Theodoratos, G.; Zografos, V.; Kazas, I.; Loukas, D.; Lambropoulos, C. P.

    2015-09-01

    Hybrid pixel detectors are made by direct converting high-Z semi-insulating single crystalline material coupled to complementary-metal-oxide semiconductor (CMOS) readout electronics. They are attractive because direct conversion exterminates all the problems of spatial localization related to light diffusion, energy resolution, is far superior from the combination of scintillation crystals and photomultipliers and lithography can be used to pattern electrodes with very fine pitch. We are developing 2-D pixel CMOS ASICs, connect them to pixilated CdTe crystals with the flip chip and bump bonding method and characterize the hybrids. We have designed a series of circuits, whose latest member consists of a 50×25 pixel array with 400um pitch and an embedded controller. In every pixel a full spectroscopic channel with time tagging information has been implemented. The detectors are targeting Compton scatter imaging and they can be used for coded aperture imaging too. Hybridization using CMOS can overcome the limit put on pixel circuit complexity by the use of thin film transistors (TFT) in large flat panels. Hybrid active pixel sensors are used in dental imaging and other applications (e.g. industrial CT etc.). Thus X-ray imaging can benefit from the work done on dynamic range enhancement methods developed initially for visible and infrared CMOS pixel sensors. A 2-D CMOS ASIC with 100um pixel pitch to demonstrate the feasibility of such methods in the context of X-ray imaging has been designed.

  5. Compact all-CMOS spatiotemporal compressive sensing video camera with pixel-wise coded exposure.

    Science.gov (United States)

    Zhang, Jie; Xiong, Tao; Tran, Trac; Chin, Sang; Etienne-Cummings, Ralph

    2016-04-18

    We present a low power all-CMOS implementation of temporal compressive sensing with pixel-wise coded exposure. This image sensor can increase video pixel resolution and frame rate simultaneously while reducing data readout speed. Compared to previous architectures, this system modulates pixel exposure at the individual photo-diode electronically without external optical components. Thus, the system provides reduction in size and power compare to previous optics based implementations. The prototype image sensor (127 × 90 pixels) can reconstruct 100 fps videos from coded images sampled at 5 fps. With 20× reduction in readout speed, our CMOS image sensor only consumes 14μW to provide 100 fps videos.

  6. Hyperspectral Single Pixel Image Sensor Project

    Data.gov (United States)

    National Aeronautics and Space Administration — This is a drastic enhancement to the current prototype which only allows us to collect visible light and reconstruct a single wavelength image. This approach is a...

  7. Efficient defect pixel cluster detection and correction for Bayer CFA image sequences

    Science.gov (United States)

    Tajbakhsh, Touraj

    2011-01-01

    Image sensor arrays may have defect pixels, either originating from manufacturing or being developed over the lifetime of the image sensor array. Continuous defect pixel detection and correction performing during camera runtime is desirable. On-the-fly detection and correction is challenging since edges and high-frequency image content might get identified as defect pixel regions and intact pixels become corrupted during defect pixel replacement. We propose a table-based detection and correction method which by and by fills the non-volatile table during normal camera operation. In this work we model defect pixels and pixel clusters to be stuck to fixed values or at least fixed to a narrow value range whereas the local neighborhood of these pixels indicate a normal behavior. The idea is to temporally observe the value ranges of small group of pixels (e.g. 4x4 pixel blocks) and to decide about their defective condition depending on their variability with respect to their neighbor pixels. Our method is computationally efficient, requires no frame buffer, requires modest memory, and therefore is appropriate to operate in line-buffer based image signal processing (ISP) systems. Our results indicate high reliability in terms of detection rates and robustness against high-frequency image content. As part of the defect pixel replacement system we also propose a simple and efficient defect pixel correction method based on the mean of medians operating on the Bayer CFA image domain.

  8. Near Future Upgrades for the CMS Pixel Detector

    CERN Document Server

    Kumar, Ashish

    2015-01-01

    The silicon pixel detector is the innermost component of the CMS tracking system, providing high precision space point measurements of charged particle trajectories. The current pixel detector is designed to operate at a maximum luminosity of $1\\times10^{34}cm^{-2}s^{-1}$. Before 2018 the instantaneous luminosity of the LHC is expected to reach $2\\times10^{34}cm^{-2}s^{-1}$, which will significantly increase the number of interactions per bunch crossing. The performance of the current pixel detector in such high occupancy environment will be degraded due to substantial data-loss and effects of radiation damage of sensors, built up over the operational period. In order to maintain or exceed its current performance, the CMS pixel detector will be replaced by a new lightweight system with additional detection layers, better acceptance and improved readout electronics. The upgraded pixel detector will provide improved track and vertex reconstruction, standalone tracking capabilities, as well as identification of ...

  9. Further applications for mosaic pixel FPA technology

    Science.gov (United States)

    Liddiard, Kevin C.

    2011-06-01

    In previous papers to this SPIE forum the development of novel technology for next generation PIR security sensors has been described. This technology combines the mosaic pixel FPA concept with low cost optics and purpose-designed readout electronics to provide a higher performance and affordable alternative to current PIR sensor technology, including an imaging capability. Progressive development has resulted in increased performance and transition from conventional microbolometer fabrication to manufacture on 8 or 12 inch CMOS/MEMS fabrication lines. A number of spin-off applications have been identified. In this paper two specific applications are highlighted: high performance imaging IRFPA design and forest fire detection. The former involves optional design for small pixel high performance imaging. The latter involves cheap expendable sensors which can detect approaching fire fronts and send alarms with positional data via mobile phone or satellite link. We also introduce to this SPIE forum the application of microbolometer IR sensor technology to IoT, the Internet of Things.

  10. Study on local inhomogeneity in TFA-MOD YBCO coated conductor by use of low temperature scanning laser microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Inoue, M. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan)]. E-mail: inoue@ees.kyushu-u.ac.jp; Kiss, T. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan); Tokutomi, H. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan); Shoyama, T. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan); Imamura, K. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan); Takeo, M. [Department of EESE, Kyushu University, Hakozaki 6-10-1, Higashi-ku, Fukuoka 812-8581 (Japan); Iijima, Y. [Fujikura Ltd., Tokyo 135-8512 (Japan); Kakimoto, K. [Fujikura Ltd., Tokyo 135-8512 (Japan); Saitoh, T. [Fujikura Ltd., Tokyo 135-8512 (Japan); Tokunaga, Y. [Superconductivity Research Laboratory, Tokyo 130-0062 (Japan); Izumi, T. [Superconductivity Research Laboratory, Tokyo 130-0062 (Japan); Shiohara, Y. [Superconductivity Research Laboratory, Tokyo 130-0062 (Japan)

    2005-10-01

    We investigated the local inhomogeneity of flux flow dissipation by use of low temperature scanning laser microscopy (LTSLM) in a Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) coated conductor obtained by the Metal-Organic Deposition process using metal trifuluoroacetate (TFA-MOD process). The LTSLM images showed that the highest J {sub c} value in local region reached almost two times higher than the minimum value, while the global J {sub c} was limited by the weakest spot. Typical length scale of the spatial inhomogeneity of J {sub c} was about several tens to hundreds {mu}m.

  11. Optical differentiation wavefront sensing with binary pixelated transmission filters.

    Science.gov (United States)

    Qiao, J; Mulhollan, Z; Dorrer, C

    2016-05-02

    Sensors measuring the spatial phase of optical waves are widely used in optics. The optical differentiation wavefront sensor (ODWS) reconstructs the wavefront of an optical wave from wavefront slope measurements obtained by inducing linear field-transmission gradients in the far-field. Its dynamic range and sensitivity can be adjusted simply by changing the gradient slope. We numerically and experimentally demonstrate the possibility of implementing the spatially varying transmission gradient using distributions of small pixels that are either transparent or opaque. Binary pixelated filters are achromatic and can be fabricated with high accuracy at relatively low cost using commercial lithography techniques. We study the impact of the noise resulting from pixelation and binarization of the far-field filter for various test wavefronts and sensor parameters. The induced wavefront error is approximately inversely proportional to the pixel size. For an ODWS with dynamic range of 100 rad/mm over a 1-cm pupil, the error is smaller than λ/15 for a wide range of test wavefronts when using 2.5-μm pixels. We experimentally demonstrate the accuracy and consistency of a first-generation ODWS based on binary pixelated filters.

  12. The first bump-bonded pixel detectors on CVD diamond

    Energy Technology Data Exchange (ETDEWEB)

    Adam, W.; Bauer, C.; Berdermann, E.; Bergonzo, P.; Bogani, F.; Borchi, E.; Brambilla, A.; Bruzzi, M.; Colledani, C.; Conway, J.; Dabrowski, W.; Delpierre, P.; Deneuville, A.; Dulinski, W.; Eijk, B. van; Fallou, A.; Fizzotti, F.; Foulon, F.; Friedl, M.; Gan, K.K.; Gheeraert, E.; Grigoriev, E.; Hallewell, G.; Hall-Wilton, R.; Han, S.; Hartjes, F.; Hrubec, J.; Husson, D.; Kagan, H.; Kania, D.; Kaplon, J.; Karl, C.; Kass, R.; Krammer, M.; Logiudice, A.; Lu, R.; Manfredi, P.F.; Manfredotti, C.; Marshall, R.D.; Meier, D.; Mishina, M.; Oh, A.; Palmieri, V.G.; Pan, L.S.; Peitz, A.; Pernicka, M.; Pirollo, S.; Polesello, P.; Pretzl, K.; Re, V.; Riester, J.L.; Roe, S.; Roff, D.; Rudge, A.; Schnetzer, S.; Sciortino, S.; Speziali, V.; Stelzer, H.; Steuerer, J.; Stone, R.; Tapper, R.J.; Tesarek, R.; Trawick, M.; Trischuk, W. E-mail: william@physics.utoronto.ca; Turchetta, R.; Vittone, E.; Wagner, A.; Walsh, A.M.; Wedenig, R.; Weilhammer, P.; Zeuner, W.; Ziock, H.; Zoeller, M.; Charles, E.; Ciocio, A.; Dao, K.; Einsweiler, K.; Fasching, D.; Gilchriese, M.; Joshi, A.; Kleinfelder, S.; Milgrome, O.; Palaio, N.; Richardson, J.; Sinervo, P.; Zizka, G

    1999-11-01

    Diamond is a nearly ideal material for detecting ionising radiation. Its outstanding radiation hardness, fast charge collection and low leakage current allow it to be used in high radiation environments. These characteristics make diamond sensors particularly appealing for use in the next generation of pixel detectors. Over the last year, the RD42 collaboration has worked with several groups that have developed pixel readout electronics in order to optimise diamond sensors for bump-bonding. This effort resulted in an operational diamond pixel sensor that was tested in a pion beam. We demonstrate that greater than 98% of the channels were successfully bump-bonded and functioning. The device shows good overall hit efficiency as well as clear spatial hit correlation to tracks measured in a silicon reference telescope. A position resolution of 14.8 {mu}m was observed, consistent with expectations given the detector pitch.

  13. An integrating CMOS APS for X-ray imaging with an in-pixel preamplifier

    Science.gov (United States)

    Abdalla, M. A.; Fröjdh, C.; Petersson, C. S.

    2001-06-01

    We present in this paper an integrating CMOS Active Pixel Sensor (APS) circuit coated with scintillator type sensors for intra-oral dental X-ray imaging systems. The photosensing element in the pixel is formed by the p-diffusion on the n-well diode. The advantage of this photosensor is its very low direct absorption of X-rays compared to the other available photosensing elements in the CMOS pixel. The pixel features an integrating capacitor in the feedback loop of a preamplifier of a finite gain in order to increase the optical sensitivity. To verify the effectiveness of this in-pixel preamplification, a prototype 32×80 element CMOS active pixel array was implemented in a 0.8 μm CMOS double poly, n-well process with a pixel pitch of 50 μm. Measured results confirmed the improved optical sensitivity performance of the APS. Various measurements on device performance are presented.

  14. Pixelated neutron image plates

    Science.gov (United States)

    Schlapp, M.; Conrad, H.; von Seggern, H.

    2004-09-01

    Neutron image plates (NIPs) have found widespread application as neutron detectors for single-crystal and powder diffraction, small-angle scattering and tomography. After neutron exposure, the image plate can be read out by scanning with a laser. Commercially available NIPs consist of a powder mixture of BaFBr : Eu2+ and Gd2O3 dispersed in a polymer matrix and supported by a flexible polymer sheet. Since BaFBr : Eu2+ is an excellent x-ray storage phosphor, these NIPs are particularly sensitive to ggr-radiation, which is always present as a background radiation in neutron experiments. In this work we present results on NIPs consisting of KCl : Eu2+ and LiF that were fabricated into ceramic image plates in which the alkali halides act as a self-supporting matrix without the necessity for using a polymeric binder. An advantage of this type of NIP is the significantly reduced ggr-sensitivity. However, the much lower neutron absorption cross section of LiF compared with Gd2O3 demands a thicker image plate for obtaining comparable neutron absorption. The greater thickness of the NIP inevitably leads to a loss in spatial resolution of the image plate. However, this reduction in resolution can be restricted by a novel image plate concept in which a ceramic structure with square cells (referred to as a 'honeycomb') is embedded in the NIP, resulting in a pixelated image plate. In such a NIP the read-out light is confined to the particular illuminated pixel, decoupling the spatial resolution from the optical properties of the image plate material and morphology. In this work, a comparison of experimentally determined and simulated spatial resolutions of pixelated and unstructured image plates for a fixed read-out laser intensity is presented, as well as simulations of the properties of these NIPs at higher laser powers.

  15. Development and characterization of diamond and 3D-silicon pixel detectors with ATLAS-pixel readout electronics

    Energy Technology Data Exchange (ETDEWEB)

    Mathes, Markus

    2008-12-15

    Hybrid pixel detectors are used for particle tracking in the innermost layers of current high energy experiments like ATLAS. After the proposed luminosity upgrade of the LHC, they will have to survive very high radiation fluences of up to 10{sup 16} particles per cm{sup 2} per life time. New sensor concepts and materials are required, which promise to be more radiation tolerant than the currently used planar silicon sensors. Most prominent candidates are so-called 3D-silicon and single crystal or poly-crystalline diamond sensors. Using the ATLAS pixel electronics different detector prototypes with a pixel geometry of 400 x 50 {mu}m{sup 2} have been built. In particular three devices have been studied in detail: a 3D-silicon and a single crystal diamond detector with an active area of about 1 cm{sup 2} and a poly-crystalline diamond detector of the same size as a current ATLAS pixel detector module (2 x 6 cm{sup 2}). To characterize the devices regarding their particle detection efficiency and spatial resolution, the charge collection inside a pixel cell as well as the charge sharing between adjacent pixels was studied using a high energy particle beam. (orig.)

  16. The Kepler Pixel Response Function

    CERN Document Server

    Bryson, Stephen T; Jenkins, Jon M; Chandrasekaran, Hema; Klaus, Todd; Caldwell, Douglas A; Gilliland, Ronald L; Haas, Michael R; Dotson, Jessie L; Koch, David G; Borucki, William J

    2010-01-01

    Kepler seeks to detect sequences of transits of Earth-size exoplanets orbiting Solar-like stars. Such transit signals are on the order of 100 ppm. The high photometric precision demanded by Kepler requires detailed knowledge of how the Kepler pixels respond to starlight during a nominal observation. This information is provided by the Kepler pixel response function (PRF), defined as the composite of Kepler's optical point spread function, integrated spacecraft pointing jitter during a nominal cadence and other systematic effects. To provide sub-pixel resolution, the PRF is represented as a piecewise-continuous polynomial on a sub-pixel mesh. This continuous representation allows the prediction of a star's flux value on any pixel given the star's pixel position. The advantages and difficulties of this polynomial representation are discussed, including characterization of spatial variation in the PRF and the smoothing of discontinuities between sub-pixel polynomial patches. On-orbit super-resolution measurement...

  17. PIXELS: Using field-based learning to investigate students' concepts of pixels and sense of scale

    Science.gov (United States)

    Pope, A.; Tinigin, L.; Petcovic, H. L.; Ormand, C. J.; LaDue, N.

    2015-12-01

    Empirical work over the past decade supports the notion that a high level of spatial thinking skill is critical to success in the geosciences. Spatial thinking incorporates a host of sub-skills such as mentally rotating an object, imagining the inside of a 3D object based on outside patterns, unfolding a landscape, and disembedding critical patterns from background noise. In this study, we focus on sense of scale, which refers to how an individual quantified space, and is thought to develop through kinesthetic experiences. Remote sensing data are increasingly being used for wide-reaching and high impact research. A sense of scale is critical to many areas of the geosciences, including understanding and interpreting remotely sensed imagery. In this exploratory study, students (N=17) attending the Juneau Icefield Research Program participated in a 3-hour exercise designed to study how a field-based activity might impact their sense of scale and their conceptions of pixels in remotely sensed imagery. Prior to the activity, students had an introductory remote sensing lecture and completed the Sense of Scale inventory. Students walked and/or skied the perimeter of several pixel types, including a 1 m square (representing a WorldView sensor's pixel), a 30 m square (a Landsat pixel) and a 500 m square (a MODIS pixel). The group took reflectance measurements using a field radiometer as they physically traced out the pixel. The exercise was repeated in two different areas, one with homogenous reflectance, and another with heterogeneous reflectance. After the exercise, students again completed the Sense of Scale instrument and a demographic survey. This presentation will share the effects and efficacy of the field-based intervention to teach remote sensing concepts and to investigate potential relationships between students' concepts of pixels and sense of scale.

  18. Upgrade of ATLAS ITk Pixel Detector

    CERN Document Server

    Huegging, Fabian; The ATLAS collaboration

    2017-01-01

    The high luminosity upgrade of the LHC (HL-LHC) in 2026 will provide new challenges to the ATLAS tracker. The current inner detector will be replaced with an entirely-silicon inner tracker (ITk) which will consist of a five barrel layer Pixel detector surrounded by a four barrel layer Strip detector. The expected high radiation levels are requiring the development of upgraded silicon sensors as well as new a front-end chip. The dense tracking environment will require finer granularity detectors and low mass global and local support structures. The data rates will require new technologies for high bandwidth data transmission and handling. The current status of the ITk ATLAS Pixel detector developments as well as different layout options will be reviewed.

  19. Monolithic pixel detectors for high energy physics

    CERN Document Server

    Snoeys, W

    2013-01-01

    Monolithic pixel detectors integrating sensor matrix and readout in one piece of silicon have revolutionized imaging for consumer applications, but despite years of research they have not yet been widely adopted for high energy physics. Two major requirements for this application, radiation tolerance and low power consumption, require charge collection by drift for the most extreme radiation levels and an optimization of the collected signal charge over input capacitance ratio ( Q / C ). It is shown that monolithic detectors can achieve Q / C for low analog power consumption and even carryout the promise to practically eliminate analog power consumption, but combining suf fi cient Q / C , collection by drift, and integration of readout circuitry within the pixel remains a challenge. An overview is given of different approaches to address this challenge, with possible advantages and disadvantages.

  20. Novel integrated CMOS pixel structures for vertex detectors

    Energy Technology Data Exchange (ETDEWEB)

    Kleinfelder, Stuart; Bieser, Fred; Chen, Yandong; Gareus, Robin; Matis, Howard S.; Oldenburg, Markus; Retiere, Fabrice; Ritter, Hans Georg; Wieman, Howard H.; Yamamoto, Eugene

    2003-10-29

    Novel CMOS active pixel structures for vertex detector applications have been designed and tested. The overriding goal of this work is to increase the signal to noise ratio of the sensors and readout circuits. A large-area native epitaxial silicon photogate was designed with the aim of increasing the charge collected per struck pixel and to reduce charge diffusion to neighboring pixels. The photogate then transfers the charge to a low capacitance readout node to maintain a high charge to voltage conversion gain. Two techniques for noise reduction are also presented. The first is a per-pixel kT/C noise reduction circuit that produces results similar to traditional correlated double sampling (CDS). It has the advantage of requiring only one read, as compared to two for CDS, and no external storage or subtraction is needed. The technique reduced input-referred temporal noise by a factor of 2.5, to 12.8 e{sup -}. Finally, a column-level active reset technique is explored that suppresses kT/C noise during pixel reset. In tests, noise was reduced by a factor of 7.6 times, to an estimated 5.1 e{sup -} input-referred noise. The technique also dramatically reduces fixed pattern (pedestal) noise, by up to a factor of 21 in our tests. The latter feature may possibly reduce pixel-by-pixel pedestal differences to levels low enough to permit sparse data scan without per-pixel offset corrections.

  1. Modelling semiconductor pixel detectors

    CERN Document Server

    Mathieson, K

    2001-01-01

    expected after 200 ps in most cases. The effect of reducing the charge carrier lifetime and examining the charge collection efficiency has been utilised to explore how these detectors would respond in a harsh radiation environment. It is predicted that over critical carrier lifetimes (10 ps to 0.1 ns) an improvement of 40 % over conventional detectors can be expected. This also has positive implications for fabricating detectors, in this geometry, from materials which might otherwise be considered substandard. An analysis of charge transport in CdZnTe pixel detectors has been performed. The analysis starts with simulation studies into the formation of contacts and their influence on the internal electric field of planar detectors. The models include a number of well known defect states and these are balanced to give an agreement with a typical experimental I-V curve. The charge transport study extends to the development of a method for studying the effect of charge sharing in highly pixellated detectors. The ...

  2. 长脉冲激光对组成CCD图像传感器的MOS光敏单元的硬破坏机理研究%Mechanism for long pulse laser-induced hard damage to the MOS pixel of CCD image sensor

    Institute of Scientific and Technical Information of China (English)

    毕娟; 张喜和; 倪晓武

    2011-01-01

    The interaction process between 1.06μm wavelength Nd:YAG long pulse laser with a millisecond pulse width and the MOS pixel of frame transfer area CCD image sensor and its hard damage mechanism are studied by the finite element method.The thermal-mechanical coupled modeling for long pulse laser irradiation of a MOS pixel is established,and the distributions of temperature and stress are obtained.The results show that the spallations between O layer and S layer appear due to the S layer radial stress on the surface exceeding the compressive strength under the action of the long pulse laser,then it will extend to the entire layer before melting by radial stress,axial stress and hoop stress.Hard damage of pixel occurs as spallation,and one pixel or an array of pixels in the laser irradiation area of CCD sensor is completely in failure.This paper could provide foundation for both laser-induced damage and protection of CCD image sensor.%以帧转移型面阵CCD图像传感器为例,采用有限元法研究了波长1.06μm,脉宽ms量级长脉冲Nd:YAG激光与组成CCD传感器的MOS光敏单元的作用过程及硬破坏机理.建立了长脉冲激光辐照MOS光敏单元的热力耦合模型,模拟了MOS光敏单元的温度分布和应力分布.研究结果表明:在长脉冲激光作用下,由于S层表面径向压应力超过其抗压强度引起MOS光敏单元出现了OS层间分裂,进而受径向、环向和轴向压应力的共同作用下,在光敏单元还未熔融时,层间分裂就扩大至光敏单元的整个OS层间.OS层间完全分裂会使光敏单元发生硬破坏,并造成CCD传感器中激光照射区的单个或一列光敏单元的功能完全失效.文章的研究结果可为CCD图像传感器的激光损伤及防护提供必要的理论依据.

  3. Extraction of depth information for 3D imaging using pixel aperture technique

    Science.gov (United States)

    Choi, Byoung-Soo; Bae, Myunghan; Kim, Sang-Hwan; Lee, Jimin; Oh, Chang-Woo; Chang, Seunghyuk; Park, JongHo; Lee, Sang-Jin; Shin, Jang-Kyoo

    2017-02-01

    A 3dimensional (3D) imaging is an important area which can be applied to face detection, gesture recognition, and 3D reconstruction. In this paper, extraction of depth information for 3D imaging using pixel aperture technique is presented. An active pixel sensor (APS) with in-pixel aperture has been developed for this purpose. In the conventional camera systems using a complementary metal-oxide-semiconductor (CMOS) image sensor, an aperture is located behind the camera lens. However, in our proposed camera system, the aperture implemented by metal layer of CMOS process is located on the White (W) pixel which means a pixel without any color filter on top of the pixel. 4 types of pixels including Red (R), Green (G), Blue (B), and White (W) pixels were used for pixel aperture technique. The RGB pixels produce a defocused image with blur, while W pixels produce a focused image. The focused image is used as a reference image to extract the depth information for 3D imaging. This image can be compared with the defocused image from RGB pixels. Therefore, depth information can be extracted by comparing defocused image with focused image using the depth from defocus (DFD) method. Size of the pixel for 4-tr APS is 2.8 μm × 2.8 μm and the pixel structure was designed and simulated based on 0.11 μm CMOS image sensor (CIS) process. Optical performances of the pixel aperture technique were evaluated using optical simulation with finite-difference time-domain (FDTD) method and electrical performances were evaluated using TCAD.

  4. Silicon pixel R&D for CLIC

    CERN Document Server

    AUTHOR|(SzGeCERN)754303

    2016-01-01

    Challenging detector requirements are imposed by the physics goals at the future multi-TeV e+e- Compact Linear Collider (CLIC). A single point resolution of 3μm for the vertex detector and 7μm for the tracker is required. Moreover, the CLIC vertex detector and tracker need to be extremely light weighted with a material budget of 0.2 % X0 per layer in the ver- tex detector and 1-2%X0 in the tracker. A fast time slicing of 10ns is further required to suppress background from beam-beam interactions. A wide range of sensor and readout ASIC technologies are investigated within the CLIC silicon pixel R&D effort. Various hybrid planar sensor assemblies with a pixel size of 25x25μm2 and 55x55μm2 have been produced and characterised by laboratory measurements and during test-beam campaigns. Experimental and simulation results for thin (50μm-500μm) slim edge and active-edge planar, and High-Voltage CMOS sensors hybridised to various readout ASICs (Timepix, Timepix3, CLICpix) are presented.

  5. Silicon pixel R&D for CLIC

    Science.gov (United States)

    Munker, M.

    2017-01-01

    Challenging detector requirements are imposed by the physics goals at the future multi-TeV e+ e‑ Compact Linear Collider (CLIC). A single point resolution of 3 μm for the vertex detector and 7 μm for the tracker is required. Moreover, the CLIC vertex detector and tracker need to be extremely light weighted with a material budget of 0.2% X0 per layer in the vertex detector and 1–2% X0 in the tracker. A fast time slicing of 10 ns is further required to suppress background from beam-beam interactions. A wide range of sensor and readout ASIC technologies are investigated within the CLIC silicon pixel R&D effort. Various hybrid planar sensor assemblies with a pixel size of 25×25 μm2 and 55×55 μm2 have been produced and characterised by laboratory measurements and during test-beam campaigns. Experimental and simulation results for thin (50 μm–500 μm) slim edge and active-edge planar, and High-Voltage CMOS sensors hybridised to various readout ASICs (Timepix, Timepix3, CLICpix) are presented.

  6. The ALICE pixel detector

    CERN Document Server

    Mercado Perez, J

    2002-01-01

    The present document is a brief summary of the performed activities during the 2001 Summer Student Programme at CERN under the Scientific Summer at Foreign Laboratories Program organized by the Particles and Fields Division of the Mexican Physical Society (Sociedad Mexicana de Fisica). In this case, the activities were related with the ALICE Pixel Group of the EP-AIT Division, under the supervision of Jeroen van Hunen, research fellow in this group. First, I give an introduction and overview to the ALICE experiment; followed by a description of wafer probing. A brief summary of the test beam that we had from July 13th to July 25th is given as well. (3 refs).

  7. Pixelated gamma detector

    Energy Technology Data Exchange (ETDEWEB)

    Dolinsky, Sergei Ivanovich; Yanoff, Brian David; Guida, Renato; Ivan, Adrian

    2016-12-27

    A pixelated gamma detector includes a scintillator column assembly having scintillator crystals and optical transparent elements alternating along a longitudinal axis, a collimator assembly having longitudinal walls separated by collimator septum, the collimator septum spaced apart to form collimator channels, the scintillator column assembly positioned adjacent to the collimator assembly so that the respective ones of the scintillator crystal are positioned adjacent to respective ones of the collimator channels, the respective ones of the optical transparent element are positioned adjacent to respective ones of the collimator septum, and a first photosensor and a second photosensor, the first and the second photosensor each connected to an opposing end of the scintillator column assembly. A system and a method for inspecting and/or detecting defects in an interior of an object are also disclosed.

  8. Increased space-bandwidth product in pixel super-resolved lensfree on-chip microscopy

    Science.gov (United States)

    Greenbaum, Alon; Luo, Wei; Khademhosseinieh, Bahar; Su, Ting-Wei; Coskun, Ahmet F.; Ozcan, Aydogan

    2013-04-01

    Pixel-size limitation of lensfree on-chip microscopy can be circumvented by utilizing pixel-super-resolution techniques to synthesize a smaller effective pixel, improving the resolution. Here we report that by using the two-dimensional pixel-function of an image sensor-array as an input to lensfree image reconstruction, pixel-super-resolution can improve the numerical aperture of the reconstructed image by ~3 fold compared to a raw lensfree image. This improvement was confirmed using two different sensor-arrays that significantly vary in their pixel-sizes, circuit architectures and digital/optical readout mechanisms, empirically pointing to roughly the same space-bandwidth improvement factor regardless of the sensor-array employed in our set-up. Furthermore, such a pixel-count increase also renders our on-chip microscope into a Giga-pixel imager, where an effective pixel count of ~1.6-2.5 billion can be obtained with different sensors. Finally, using an ultra-violet light-emitting-diode, this platform resolves 225 nm grating lines and can be useful for wide-field on-chip imaging of nano-scale objects, e.g., multi-walled-carbon-nanotubes.

  9. Imaging by photon counting with 256 x 256 pixel matrix

    CERN Document Server

    Tlustos, Lukas; Heijne, Erik H M; Llopart-Cudie, Xavier

    2004-01-01

    Using 0.25 mum standard CMOS we have developed 2-D semiconductor matrix detectors with sophisticated functionality integrated inside each pixel of a hybrid sensor module. One of these sensor modules is a matrix of 256 multiplied by 256 square 55mum pixels intended for X- ray imaging. This device is called 'Medipix2' and features a fast amplifier and two-level discrimination for signals between 1000 and 100000 equivalent electrons, with overall signal noise similar to 150 e- rms. Signal polarity and comparator thresholds are programmable. A maximum count rate of nearly 1 MHz per pixel can be achieved, which corresponds to an average flux of 3 multiplied by 10exp10 photons per cm2. The selected signals can be accumulated in each pixel in a 13- bit register. The serial readout takes 5-10 ms. A parallel readout of similar to 300 mus could also be used. Housekeeping functions such as local dark current compensation, test pulse generation, silencing of noisy pixels and threshold tuning in each pixel contribute to t...

  10. Planar Pixelations and Image Recognition

    CERN Document Server

    Rowekamp, Brandon

    2011-01-01

    Any subset of the plane can be approximated by a set of square pixels. This transition from a shape to its pixelation is rather brutal since it destroys geometric and topological information about the shape. Using a technique inspired by Morse Theory, we algorithmically produce a PL approximation of the original shape using only information from its pixelation. This approximation converges to the original shape in a very strong sense: as the size of the pixels goes to zero we can recover important geometric and topological invariants of the original shape such as Betti numbers, area, perimeter and curvature measures.

  11. ATLAS IBL sensor qualifiaction

    CERN Document Server

    Weingarten, J; The ATLAS collaboration

    2011-01-01

    The upgrade for the ATLAS detector will undergo different phases towards HL-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (foreseen for 2013-14). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.2 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reduction of the pixel size and of the material budget. Two different promising Silicon sensor technologies (Planar n-in-n and 3D) are currently under investigation for the pixel detector. An overview of the sensor technologies qualification with particular emphasis on irradiation and beam tests will be presented.

  12. ATLAS IBL Sensor Qualification

    CERN Document Server

    Weingarten, J; The ATLAS collaboration

    2011-01-01

    The upgrade for the ATLAS detector will undergo different phases towards HL-LHC. The first upgrade for the Pixel Detector will consist in the construction of a new pixel layer which will be installed during the first shutdown of the LHC machine (foreseen for 2013-14). The new detector, called Insertable B-Layer (IBL), will be inserted between the existing pixel detector and a new (smaller radius) beam-pipe at a radius of 3.2 cm. The IBL will require the development of several new technologies to cope with increase of radiation or pixel occupancy and also to improve the physics performance which will be achieved by reduction of the pixel size and of the material budget. Two different promising Silicon sensor technologies (Planar n-in-n and 3D) are currently under investigation for the pixel detector. An overview of the sensor technologies qualification with particular emphasis on irradiation and beam tests will be presented.

  13. Automated procedures for the assembly of the CMS Phase 1 upgrade pixel modules

    Science.gov (United States)

    Wade, Alex; CMS Collaboration

    2016-03-01

    The Phase 1 upgrade of the pixel tracker for the CMS experiment requires the assembly of approximately 1000 modules consisting of pixel sensors bump bonded to readout chips. The precision assembly of modules in this volume is made possible using several robotic processes for dispensing epoxy,positioning of sensor components, automatic wire-bonding and robotic deposition of elastomer for wire bond encapsulation. We will describe the these processes in detail, along with the measurements that quanitfy the quality of assembled modules, and describe the subsequent steps in which the sensor modules are used in the construction of the Phase 1 pixel tracker. With support from USCMS.

  14. Performance of silicon pixel detectors at small track incidence angles

    CERN Document Server

    Viel, Simon; The ATLAS collaboration

    2015-01-01

    In order to enable the ATLAS experiment to successfully track charged particles produced in high-energy collisions at the High-Luminosity Large Hadron Collider, the current ATLAS Inner Detector will be replaced by the Inner Tracker (ITk), entirely composed of silicon pixel and strip detectors. An extension of the tracking coverage of ITk to very forward pseudorapidity values is proposed, using pixel modules placed in a long cylindrical layer around the beam pipe. The measurement of long pixel clusters, detected when charged particles cross the silicon sensor at small incidence angles, has potential to significantly improve the tracking efficiency, fake track rejection, and resolution of ITk in the very forward region. The performance of state-of-the-art pixel modules at small track incidence angles is studied using test beam data collected at SLAC and CERN, as well as simulated data.

  15. Monolithic pixels on moderate resistivity substrate and sparsifying readout architecture

    Science.gov (United States)

    Giubilato, P.; Battaglia, M.; Bisello, D.; Caselle, M.; Chalmet, P.; Demaria, L.; Ikemoto, Y.; Kloukinas, K.; Mansuy, S. C.; Mattiazzo, S.; Marchioro, A.; Mugnier, H.; Pantano, D.; Potenza, A.; Rivetti, A.; Rousset, J.; Silvestrin, L.; Snoeys, W.

    2013-12-01

    The LePix projects aim realizing a new generation monolithic pixel detectors with improved performances at lesser cost with respect to both current state of the art monolithic and hybrid pixel sensors. The detector is built in a 90 nm CMOS process on a substrate of moderate resistivity. This allows charge collection by drift while maintaining the other advantages usually offered by MAPS, like having a single piece detector and using a standard CMOS production line. The collection by drift mechanism, coupled to the low capacitance design of the collecting node made possible by the monolithic approach, provides an excellent signal to noise ratio straight at the pixel cell together with a radiation tolerance far superior to conventional un-depleted MAPS. The excellent signal-to-noise performance is demonstrated by the device ability to separate the 6 keV 55Fe double peak at room temperature. To achieve high granularity (10-20 μm pitch pixels) over large detector areas maintaining high readout speed, a completely new compressing architecture has been devised. This architecture departs from the mainstream hybrid pixel sparsification approach, which uses in-pixel logic to reduce data, by using topological compression to minimize pixel area and power consumption.

  16. Diamond and silicon pixel detectors in high radiation environments

    Energy Technology Data Exchange (ETDEWEB)

    Tsung, Jieh-Wen

    2012-10-15

    Diamond pixel detector is a promising candidate for tracking of collider experiments because of the good radiation tolerance of diamond. The diamond pixel detector must withstand the radiation damage from 10{sup 16} particles per cm{sup 2}, which is the expected total fluence in High Luminosity Large Hadron Collider. The performance of diamond and silicon pixel detectors are evaluated in this research in terms of the signal-to-noise ratio (SNR). Single-crystal diamond pixel detectors with the most recent readout chip ATLAS FE-I4 are produced and characterized. Based on the results of the measurement, the SNR of diamond pixel detector is evaluated as a function of radiation fluence, and compared to that of planar-silicon ones. The deterioration of signal due to radiation damage is formulated using the mean free path of charge carriers in the sensor. The noise from the pixel readout circuit is simulated and calculated with leakage current and input capacitance to the amplifier as important parameters. The measured SNR shows good agreement with the calculated and simulated results, proving that the performance of diamond pixel detectors can exceed the silicon ones if the particle fluence is more than 10{sup 15} particles per cm{sup 2}.

  17. Characterization of the CMS Pixel Detectors

    CERN Document Server

    Gu, Weihua

    2002-01-01

    In 2005 the Large Hadron Collider (LHC) will start the pp collisions at a high luminosity and at a center of mass energy of 14 TeV. The primary goal of the experimental programme is the search of the Higgs boson(s) and the supersymmetric particles. The programme is also proposed to detect a range of diverse signatures in order to provide guidance for future physics. The pixel detector system makes up the innermost part of the CMS experiment, which is one of the two general purpose detectors at the LHC. The main tasks of the system are vertex detection and flavor tagging. The high luminosity and the high particle multiplicity as well as the small bunch spacing at the LHC impose great challenges on the pixel detectors: radiation hardness of sensors and electronics, fast signal processing and a high granularity are the essential requirements. This thesis concentrates on the study of the suitability of two test stands, which are implemented to characterize the CMS pixel detectors: one is con-cerned with test puls...

  18. CMOS integrator based lock-in pixel for heterodyne interferometry

    NARCIS (Netherlands)

    Soloviev, O.; Vdovin, G.

    2005-01-01

    This article presents a prototype of a CMOS phase sensor for high accuracy (1 Angstrom) heterodyne interferometry. Switched integrators realization of a lock-in pixel for 4-bucket phase detection algorithm is described and illustrated by experimental results. Factors that limit the accuracy of this

  19. Overview of the ATLAS Insertable B-Layer Pixel Detector

    CERN Document Server

    Pernegger, H; The ATLAS collaboration

    2011-01-01

    ATLAS currently develops a new pixel detector for the first upgrade of its tracking system: The ATLAS Insertable B-Layer Pixel detector (IBL). The new layer will be inserted between the inner most layer of the current pixel detector and a new beam pipe. The sensors are placed at a radius of 3.4cm. The expected high radiation levels and high hit occupancy require new developments for front-end chip and the sensor which can stand radiation levels beyond 5E15 neq/cm2. ATLAS has developed the new FEI4 and new silicon sensors to be used as pixel modules. Furthermore a new lightweight support and cooling structure was developed, which minimizes the overall radiation and allows detector cooling with CO2 at -40C coolant temperature. Currently the overall integration and installation procedure is being developed and test ready for installation in ATLAS in 2013. The presentation summarizes the current state of development of IBL modules, first preliminary test results of the new chip with new sensors, the construction ...

  20. ATLAS Pixel Radiation Monitoring with HVPP4 System

    CERN Document Server

    Gorelov, Igor; Seidel, Sally; Toms, Konstantin

    2009-01-01

    In this talk we present the basis for the protocol for radiation monitoring of the ATLAS Pixel Sensors. The monitoring is based on a current measurement system, HVPP4. The status on the ATLAS HVPP4 system development is also presented.

  1. Imaging by photon counting with 256x256 pixel matrix

    Science.gov (United States)

    Tlustos, Lukas; Campbell, Michael; Heijne, Erik H. M.; Llopart, Xavier

    2004-09-01

    Using 0.25µm standard CMOS we have developed 2-D semiconductor matrix detectors with sophisticated functionality integrated inside each pixel of a hybrid sensor module. One of these sensor modules is a matrix of 256x256 square 55µm pixels intended for X-ray imaging. This device is called 'Medipix2' and features a fast amplifier and two-level discrimination for signals between 1000 and 100000 equivalent electrons, with overall signal noise ~150 e- rms. Signal polarity and comparator thresholds are programmable. A maximum count rate of nearly 1 MHz per pixel can be achieved, which corresponds to an average flux of 3x10exp10 photons per cm2. The selected signals can be accumulated in each pixel in a 13-bit register. The serial readout takes 5-10 ms. A parallel readout of ~300 µs could also be used. Housekeeping functions such as local dark current compensation, test pulse generation, silencing of noisy pixels and threshold tuning in each pixel contribute to the homogeneous response over a large sensor area. The sensor material can be adapted to the energy of the X-rays. Best results have been obtained with high-resistivity silicon detectors, but also CdTe and GaAs detectors have been used. The lowest detectable X-ray energy was about 4 keV. Background measurements have been made, as well as measurements of the uniformity of imaging by photon counting. Very low photon count rates are feasible and noise-free at room temperature. The readout matrix can be used also with visible photons if an energy or charge intensifier structure is interposed such as a gaseous amplification layer or a microchannel plate or acceleration field in vacuum.

  2. The Belle II DEPFET pixel detector

    Energy Technology Data Exchange (ETDEWEB)

    Moser, Hans-Günther, E-mail: moser@mpp.mpg.de

    2016-09-21

    The Belle II experiment at KEK (Tsukuba, Japan) will explore heavy flavour physics (B, charm and tau) at the starting of 2018 with unprecedented precision. Charged particles are tracked by a two-layer DEPFET pixel device (PXD), a four-layer silicon strip detector (SVD) and the central drift chamber (CDC). The PXD will consist of two layers at radii of 14 mm and 22 mm with 8 and 12 ladders, respectively. The pixel sizes will vary, between 50 μm×(55–60) μm in the first layer and between 50 μm×(70–85) μm in the second layer, to optimize the charge sharing efficiency. These innermost layers have to cope with high background occupancy, high radiation and must have minimal material to reduce multiple scattering. These challenges are met using the DEPFET technology. Each pixel is a FET integrated on a fully depleted silicon bulk. The signal charge collected in the ‘internal gate’ modulates the FET current resulting in a first stage amplification and therefore very low noise. This allows very thin sensors (75 μm) reducing the overall material budget of the detector (0.21% X{sub 0}). Four fold multiplexing of the column parallel readout allows read out a full frame of the pixel matrix in only 20 μs while keeping the power consumption low enough for air cooling. Only the active electronics outside the detector acceptance has to be cooled actively with a two phase CO{sub 2} system. Furthermore the DEPFET technology offers the unique feature of an electronic shutter which allows the detector to operate efficiently in the continuous injection mode of superKEKB.

  3. The Belle II DEPFET pixel detector

    Science.gov (United States)

    Moser, Hans-Günther

    2016-09-01

    The Belle II experiment at KEK (Tsukuba, Japan) will explore heavy flavour physics (B, charm and tau) at the starting of 2018 with unprecedented precision. Charged particles are tracked by a two-layer DEPFET pixel device (PXD), a four-layer silicon strip detector (SVD) and the central drift chamber (CDC). The PXD will consist of two layers at radii of 14 mm and 22 mm with 8 and 12 ladders, respectively. The pixel sizes will vary, between 50 μm×(55-60) μm in the first layer and between 50 μm×(70-85) μm in the second layer, to optimize the charge sharing efficiency. These innermost layers have to cope with high background occupancy, high radiation and must have minimal material to reduce multiple scattering. These challenges are met using the DEPFET technology. Each pixel is a FET integrated on a fully depleted silicon bulk. The signal charge collected in the 'internal gate' modulates the FET current resulting in a first stage amplification and therefore very low noise. This allows very thin sensors (75 μm) reducing the overall material budget of the detector (0.21% X0). Four fold multiplexing of the column parallel readout allows read out a full frame of the pixel matrix in only 20 μs while keeping the power consumption low enough for air cooling. Only the active electronics outside the detector acceptance has to be cooled actively with a two phase CO2 system. Furthermore the DEPFET technology offers the unique feature of an electronic shutter which allows the detector to operate efficiently in the continuous injection mode of superKEKB.

  4. Optical Cloud Pixel Recovery via Machine Learning

    Directory of Open Access Journals (Sweden)

    Subrina Tahsin

    2017-05-01

    Full Text Available Remote sensing derived Normalized Difference Vegetation Index (NDVI is a widely used index to monitor vegetation and land use change. NDVI can be retrieved from publicly available data repositories of optical sensors such as Landsat, Moderate Resolution Imaging Spectro-radiometer (MODIS and several commercial satellites. Studies that are heavily dependent on optical sensors are subject to data loss due to cloud coverage. Specifically, cloud contamination is a hindrance to long-term environmental assessment when using information from satellite imagery retrieved from visible and infrared spectral ranges. Landsat has an ongoing high-resolution NDVI record starting from 1984. Unfortunately, this long time series NDVI data suffers from the cloud contamination issue. Though both simple and complex computational methods for data interpolation have been applied to recover cloudy data, all the techniques have limitations. In this paper, a novel Optical Cloud Pixel Recovery (OCPR method is proposed to repair cloudy pixels from the time-space-spectrum continuum using a Random Forest (RF trained and tested with multi-parameter hydrologic data. The RF-based OCPR model is compared with a linear regression model to demonstrate the capability of OCPR. A case study in Apalachicola Bay is presented to evaluate the performance of OCPR to repair cloudy NDVI reflectance. The RF-based OCPR method achieves a root mean squared error of 0.016 between predicted and observed NDVI reflectance values. The linear regression model achieves a root mean squared error of 0.126. Our findings suggest that the RF-based OCPR method is effective to repair cloudy pixels and provides continuous and quantitatively reliable imagery for long-term environmental analysis.

  5. TFaNS Tone Fan Noise Design/Prediction System. Volume 1; System Description, CUP3D Technical Documentation and Manual for Code Developers

    Science.gov (United States)

    Topol, David A.

    1999-01-01

    TFaNS is the Tone Fan Noise Design/Prediction System developed by Pratt & Whitney under contract to NASA Lewis (presently NASA Glenn). The purpose of this system is to predict tone noise emanating from a fan stage including the effects of reflection and transmission by the rotor and stator and by the duct inlet and nozzle. These effects have been added to an existing annular duct/isolated stator noise prediction capability. TFaNS consists of: The codes that compute the acoustic properties (reflection and transmission coefficients) of the various elements and write them to files. Cup3D: Fan Noise Coupling Code that reads these files, solves the coupling problem, and outputs the desired noise predictions. AWAKEN: CFD/Measured Wake Postprocessor which reformats CFD wake predictions and/or measured wake data so it can be used by the system. This volume of the report provides technical background for TFaNS including the organization of the system and CUP3D technical documentation. This document also provides information for code developers who must write Acoustic Property Files in the CUP3D format. This report is divided into three volumes: Volume I: System Description, CUP3D Technical Documentation, and Manual for Code Developers; Volume II: User's Manual, TFaNS Vers. 1.4; Volume III: Evaluation of System Codes.

  6. From Pixels to Planets

    Science.gov (United States)

    Brownston, Lee; Jenkins, Jon M.

    2015-01-01

    The Kepler Mission was launched in 2009 as NASAs first mission capable of finding Earth-size planets in the habitable zone of Sun-like stars. Its telescope consists of a 1.5-m primary mirror and a 0.95-m aperture. The 42 charge-coupled devices in its focal plane are read out every half hour, compressed, and then downlinked monthly. After four years, the second of four reaction wheels failed, ending the original mission. Back on earth, the Science Operations Center developed the Science Pipeline to analyze about 200,000 target stars in Keplers field of view, looking for evidence of periodic dimming suggesting that one or more planets had crossed the face of its host star. The Pipeline comprises several steps, from pixel-level calibration, through noise and artifact removal, to detection of transit-like signals and the construction of a suite of diagnostic tests to guard against false positives. The Kepler Science Pipeline consists of a pipeline infrastructure written in the Java programming language, which marshals data input to and output from MATLAB applications that are executed as external processes. The pipeline modules, which underwent continuous development and refinement even after data started arriving, employ several analytic techniques, many developed for the Kepler Project. Because of the large number of targets, the large amount of data per target and the complexity of the pipeline algorithms, the processing demands are daunting. Some pipeline modules require days to weeks to process all of their targets, even when run on NASA's 128-node Pleiades supercomputer. The software developers are still seeking ways to increase the throughput. To date, the Kepler project has discovered more than 4000 planetary candidates, of which more than 1000 have been independently confirmed or validated to be exoplanets. Funding for this mission is provided by NASAs Science Mission Directorate.

  7. Pixel Detector Developments for Tracker Upgrades of the High Luminosity LHC

    CERN Document Server

    Meschini, Marco; Dalla Betta, G. F; Dinardo, Mauro; Giacomini, G; Menasce, Dario; Mendicino, R; Messineo, Alberto; Moroni, Luigi; Ronchin, S; Sultan, D.M.S; Uplegger, Lorenzo; Viliani, Lorenzo; Zoi, Irene; Zuolo, Davide

    2017-01-01

    and 3D devices. The results on the 3D pixel sensors before irradiation are very satisfactory and % make us confident support the conclusion that columnar devices are % 3D devices very good candidates for the inner layers of the upgrade pixel detectors.

  8. Beam test results of the BTeV silicon pixel detector

    CERN Document Server

    Appel, J A

    2001-01-01

    We report the results of the BTeV silicon pixel detector tests carried out in the MTest beam at Fermilab in 1999-2000. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.

  9. Development of n-in-p pixel modules for the ATLAS upgrade at HL-LHC

    Science.gov (United States)

    Macchiolo, A.; Nisius, R.; Savic, N.; Terzo, S.

    2016-09-01

    Thin planar pixel modules are promising candidates to instrument the inner layers of the new ATLAS pixel detector for HL-LHC, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. 100-200 μm thick sensors, interconnected to FE-I4 read-out chips, have been characterized with radioactive sources and beam tests at the CERN-SPS and DESY. The results of these measurements are reported for devices before and after irradiation up to a fluence of 14 ×1015 neq /cm2 . The charge collection and tracking efficiency of the different sensor thicknesses are compared. The outlook for future planar pixel sensor production is discussed, with a focus on sensor design with the pixel pitches (50×50 and 25×100 μm2) foreseen for the RD53 Collaboration read-out chip in 65 nm CMOS technology. An optimization of the biasing structures in the pixel cells is required to avoid the hit efficiency loss presently observed in the punch-through region after irradiation. For this purpose the performance of different layouts have been compared in FE-I4 compatible sensors at various fluence levels by using beam test data. Highly segmented sensors will represent a challenge for the tracking in the forward region of the pixel system at HL-LHC. In order to reproduce the performance of 50×50 μm2 pixels at high pseudo-rapidity values, FE-I4 compatible planar pixel sensors have been studied before and after irradiation in beam tests at high incidence angle (80°) with respect to the short pixel direction. Results on cluster shapes, charge collection and hit efficiency will be shown.

  10. Bump bonding of pixel systems

    Energy Technology Data Exchange (ETDEWEB)

    Lozano, M. E-mail: manuel.lozano@cnm.es; Cabruja, E.; Collado, A.; Santander, J.; Ullan, M

    2001-11-01

    A pixel detector consists of an array of radiation sensing elements which is connected to an electronic read-out unit. Many different ways of making this connection between these two different devices are currently being used or considered to be used in the next future. Bonding techniques such as flip chip technology can present real advantages because they allow very fine pitch and a high number of I/Os. This paper presents a review of the different flip chip technologies available and their suitability for manufacturing pixel detectors. The particular problems concerning testing of pixel detectors and thermal issues related to them are pointed out.

  11. Bump bonding of pixel systems

    CERN Document Server

    Lozano, M; Collado, A; Santander, J; Ullán, M

    2001-01-01

    A pixel detector consists of an array of radiation sensing elements which is connected to an electronic read-out unit. Many different ways of making this connection between these two different devices are currently being used or considered to be used in the next future. Bonding techniques such as flip chip technology can present real advantages because they allow very fine pitch and a high number of I/Os. This paper presents a review of the different flip chip technologies available and their suitability for manufacturing pixel detectors. The particular problems concerning testing of pixel detectors and thermal issues related to them are pointed out.

  12. CMS Barrel Pixel Detector Overview

    CERN Document Server

    Kästli, H C; Erdmann, W; Gabathuler, K; Hörmann, C; Horisberger, Roland Paul; König, S; Kotlinski, D; Meier, B; Robmann, P; Rohe, T; Streuli, S

    2007-01-01

    The pixel detector is the innermost tracking device of the CMS experiment at the LHC. It is built from two independent sub devices, the pixel barrel and the end disks. The barrel consists of three concentric layers around the beam pipe with mean radii of 4.4, 7.3 and 10.2 cm. There are two end disks on each side of the interaction point at 34.5 cm and 46.5 cm. This article gives an overview of the pixel barrel detector, its mechanical support structure, electronics components, services and its expected performance.

  13. Capacitively coupled hybrid pixel assemblies for the CLIC vertex detector

    CERN Document Server

    AUTHOR|(SzGeCERN)734627; Benoit, Mathieu; Dannheim, Dominik; Dette, Karola; Hynds, Daniel; Kulis, Szymon; Peric, Ivan; Petric, Marko; Redford, Sophie; Sicking, Eva; Valerio, Pierpaolo

    2016-01-01

    The vertex detector at the proposed CLIC multi-TeV linear e+e- collider must have minimal material content and high spatial resolution, combined with accurate time-stamping to cope with the expected high rate of beam-induced backgrounds. One of the options being considered is the use of active sensors implemented in a commercial high-voltage CMOS process, capacitively coupled to hybrid pixel ASICs. A prototype of such an assembly, using two custom designed chips (CCPDv3 as active sensor glued to a CLICpix readout chip), has been characterised both in the lab and in beam tests at the CERN SPS using 120 GeV/c positively charged hadrons. Results of these characterisation studies are presented both for single and dual amplification stages in the active sensor. Pixel cross-coupling results are also presented, showing the sensitivity to placement precision and planarity of the glue layer.

  14. GaAs Medipix2 hybrid pixel detector

    CERN Document Server

    Kostamo, P; Vähänen, S; Tlustos, L; Fröjdh, C; Campbell, M; Zhilyaev, Y; Lipsanen, H

    2008-01-01

    A GaAs Medipix2 hybrid pixel detector based on high purity epitaxial GaAs material was successfully fabricated. The mesa type GaAs sensor with 256×256 pixels and total area of 1.4×1.4 cm2 was made of a 140-μm-thick epitaxial p–i–n structure utilizing reactive ion etching. A final thickness of approximately 110 μm for the all-epitaxial sensor element is achieved by back-thinning procedure. The sensor element is bump bonded to a Medipix2 read-out ASIC. The detector is capable of room temperature spectroscopic operation and it demonstrates the potential of GaAs for high resolution X-ray imaging systems operating at room temperature. This work describes the manufacturing process and electrical properties of the GaAs Medipix2 hybrid detector.

  15. Module and Electronics Developments for the ATLAS ITK Pixel System

    CERN Document Server

    Nellist, Clara; The ATLAS collaboration

    2016-01-01

    ATLAS is preparing for an extensive modification of its detector in the course of the planned HL-LHC accelerator upgrade around 2025 which includes a replacement of the entire tracking system by an all-silicon detector (Inner Tracker, ITk). The five innermost layers of ITk will comprise of a pixel detector built of new sensor and readout electronics technologies to improve the tracking performance and cope with the severe HL-LHC environment in terms of occupancy and radiation. The total area of the new pixel system could measure up to 14 m$^{2}$, depending on the final layout choice that is expected to take place in early 2017. An intense R\\&D activity is taking place in the field of planar, 3D, CMOS sensors to identify the optimal technology for the different pixel layers. In parallel various sensor-chip interconnection options are explored to identify reliable technologies when employing 100-150~$\\mu$m thin chips. While the new read-out chip is being developed by the RD53 Collaboration, the pixel off de...

  16. The ATLAS Insertable B-Layer Pixel Detector

    CERN Document Server

    Pernegger, H; The ATLAS collaboration

    2011-01-01

    ATLAS currently develops a new pixel detector for the first upgrade of its tracking system: The ATLAS Insertable B-Layer Pixel detector (IBL). The new layer will be inserted between the inner most layer of the current pixel detector and a new beam pipe. The sensors are placed at a radius of 3.4 cm. The expected high radiation levels and high hit occupancy require new developments for front-end chip and sensors which can stand radiation levels beyond 5$ imes$10$^{15}$ n$_{eq}$/cm$^{2}$ . ATLAS has developed the new FEI4 chip and new silicon sensors to be used as pixel modules. Furthermore a new lightweight support and cooling structure was developed, which minimizes the overall radiation length and allows detector cooling with CO$_{2}$ at -40 $^{circ}$C coolant temperature. Currently the overall integration and installation procedure is being developed and tested ready for installation in 2013. The paper summarizes the current state of development of IBL modules, first preliminary test results of the new chip ...

  17. Module and Electronics Developments for the ATLAS ITK Pixel System

    CERN Document Server

    Rummler, Andr{e}; The ATLAS collaboration

    2016-01-01

    The entire tracking system of the ATLAS experiment will be replaced during the LHC Phase II shutdown around 2025 by an all-silicon detector (Inner Tracker, ITk). The pixel detector will be composed by the five innermost layers, instrumented with new sensor and readout electronics technologies to improve the tracking performance and cope with the severe HL-LHC environment in terms of occupancy and radiation. The total area of the new pixel system could measure up to 14 m^2, depending on the final layout choice that is expected to take place in early 2017. Different designs of planar, 3D, CMOS sensors are being investigated to identify the optimal technology for the different pixel layers. In parallel sensor-chip interconnection options are evaluated in collaboration with industrial partners to identify reliable technologies when employing 100-150 μm thin chips. While the new read-out chip is being developed by the RD53 Collaboration, the pixel off detector read-out electronics will be implemented in the frame...

  18. Dynamic Efficiency Measurements for Irradiated ATLAS Pixel Single Chip Modules

    CERN Document Server

    Pfaff, Mike; Grosse-Knetter, Jorn

    2011-01-01

    The ATLAS pixel detector is the innermost subdetector of the ATLAS experiment. Due to this, the pixel detector has to be particularly radiation hard. In this diploma thesis effects on the sensor and the electronics which are caused by irradiation are examined. It is shown how the behaviour changes between an unirradiated sample and a irradiated sample, which was treated with the same radiation dose that is expected at the end of the lifetime of ATLAS. For this study a laser system, which is used for dynamic efficiency measurements was constructed. Furthermore, the behaviour of the noise during the detection of a particle was evaluated studied.

  19. Micro-digital sun sensor: an imaging sensor for space applications

    NARCIS (Netherlands)

    Xie, N.; Theuwissen, A.J.P.; Büttgen, B.; Hakkesteegt, H.C.; Jasen, H.; Leijtens, J.A.P.

    2010-01-01

    Micro-Digital Sun Sensor is an attitude sensor which senses relative position of micro-satellites to the sun in space. It is composed of a solar cell power supply, a RF communication block and an imaging chip which is called APS+. The APS+ integrates a CMOS Active Pixel Sensor (APS) of 512×512 pixel

  20. Development of planar pixel modules for the ATLAS high luminosity LHC tracker upgrade

    Energy Technology Data Exchange (ETDEWEB)

    Allport, P.P. [Department of Physics, University of Liverpool (United Kingdom); Ashby, J.; Bates, R.L.; Blue, A. [SUPA, School of Physics and Astronomy, University of Glasgow (United Kingdom); Burdin, S. [Department of Physics, University of Liverpool (United Kingdom); Buttar, C.M., E-mail: craig.buttar@glasgow.ac.uk [SUPA, School of Physics and Astronomy, University of Glasgow (United Kingdom); Casse, G.; Dervan, P. [Department of Physics, University of Liverpool (United Kingdom); Doonan, K. [SUPA, School of Physics and Astronomy, University of Glasgow (United Kingdom); Forshaw, D. [Department of Physics, University of Liverpool (United Kingdom); Lipp, J. [The Science and Technology Facilities Council, Rutherford Appleton Laboratory (United Kingdom); McMullen, T. [SUPA, School of Physics and Astronomy, University of Glasgow (United Kingdom); Pater, J. [School of Physics and Astronomy, University of Manchester (United Kingdom); Stewart, A. [SUPA, School of Physics and Astronomy, University of Glasgow (United Kingdom); Tsurin, I. [Department of Physics, University of Liverpool (United Kingdom)

    2014-11-21

    The high-luminosity LHC will present significant challenges for tracking systems. ATLAS is preparing to upgrade the entire tracking system, which will include a significantly larger pixel detector. This paper reports on the development of large area planar detectors for the outer pixel layers and the pixel endcaps. Large area sensors have been fabricated and mounted onto 4 FE-I4 readout ASICs, the so-called quad-modules, and their performance evaluated in the laboratory and testbeam. Results from characterisation of sensors prior to assembly, experience with module assembly, including bump-bonding and results from laboratory and testbeam studies are presented.

  1. Recent development of ultra small pixel uncooled focal plane arrays at DRS

    Science.gov (United States)

    Li, Chuan; Skidmore, George D.; Howard, Christopher; Han, C. J.; Wood, Lewis; Peysha, Doug; Williams, Eric; Trujillo, Carlos; Emmett, Jeff; Robas, Gary; Jardine, Daniel; Wan, C.-F.; Clarke, Elwood

    2007-04-01

    DRS is a major supplier of the 25μm pixel pitch 640x480 and 320x240 infrared uncooled focal plane arrays (UFPAs) and camera products for commercial and military markets. The state-of-the-art 25μm pixel focal plane arrays currently in production provide excellent performance for soldier thermal weapon sights (TWS), vehicle driver vision enhancers (DVE), and aerial surveillance and industrial thermograph applications. To further improve sensor resolution and reduce the sensor system size, weight and cost, it is highly desired to reduce the UFPA pixel size. However, the 17μm pixel FPA presents significant design and fabrication challenges as compared with 25μm pixel FPAs. The design objectives, engineering trade-offs, and performance goals will be discussed. This paper presents an overview of the 17μm microblometer uncooled focal plane arrays and sensor electronics production and development activities at DRS. The 17 μm pixel performance data from several initial fabrication lots will be summarized. Relevant 25μm pixel performance data are provided for comparison. Thermal images and video from the 17μm pixel 640x480 UFPA will also be presented.

  2. Neural network based cluster creation in the ATLAS silicon Pixel Detector

    CERN Document Server

    Andreazza, A; The ATLAS collaboration

    2013-01-01

    The read-out from individual pixels on planar semi-conductor sensors are grouped into clusters to reconstruct the location where a charged particle passed through the sensor. The resolution given by individual pixel sizes is significantly improved by using the information from the charge sharing between pixels. Such analog cluster creation techniques have been used by the ATLAS experiment for many years to obtain an excellent performance. However, in dense environments, such as those inside high-energy jets, clusters have an increased probability of merging the charge deposited by multiple particles. Recently, a neural network based algorithm which estimates both the cluster position and whether a cluster should be split has been developed for the ATLAS Pixel Detector. The algorithm significantly reduces ambiguities in the assignment of pixel detector measurement to tracks within jets and improves the position accuracy with respect to standard interpolation techniques by taking into account the 2-dimensional ...

  3. GigaTracker, a Thin and Fast Silicon Pixels Tracker

    CERN Document Server

    Velghe, Bob; Bonacini, Sandro; Ceccucci, Augusto; Kaplon, Jan; Kluge, Alexander; Mapelli, Alessandro; Morel, Michel; Noël, Jérôme; Noy, Matthew; Perktold, Lukas; Petagna, Paolo; Poltorak, Karolina; Riedler, Petra; Romagnoli, Giulia; Chiozzi, Stefano; Cotta Ramusino, Angelo; Fiorini, Massimiliano; Gianoli, Alberto; Petrucci, Ferruccio; Wahl, Heinrich; Arcidiacono, Roberta; Jarron, Pierre; Marchetto, Flavio; Gil, Eduardo Cortina; Nuessle, Georg; Szilasi, Nicolas

    2014-01-01

    GigaTracker, the NA62’s upstream spectrometer, plays a key role in the kinematically constrained background suppression for the study of the K + ! p + n ̄ n decay. It is made of three independent stations, each of which is a six by three cm 2 hybrid silicon pixels detector. To meet the NA62 physics goals, GigaTracker has to address challenging requirements. The hit time resolution must be better than 200 ps while keeping the total thickness of the sensor to less than 0.5 mm silicon equivalent. The 200 μm thick sensor is divided into 18000 300 μm 300 μm pixels bump-bounded to ten independent read-out chips. The chips use an end-of-column architecture and rely on time-over- threshold discriminators. A station can handle a crossing rate of 750 MHz. Microchannel cooling technology will be used to cool the assembly. It allows us to keep the sensor close to 0 C with 130 μm of silicon in the beam area. The sensor and read-out chip performance were validated using a 45 pixel demonstrator with a laser test setu...

  4. The Phase II ATLAS ITk Pixel Upgrade

    CERN Document Server

    Terzo, Stefano; The ATLAS collaboration

    2017-01-01

    The entire tracking system of the ATLAS experiment will be replaced during the LHC Phase II shutdown (foreseen to take place around 2025) by an all-silicon detector called the "ITk" (Inner Tracker). The innermost portion of ITk will consist of a pixel detector with five layers in the barrel region and and ring-shaped supports in the endcap regions. It will be instrumented with new sensor and readout electronics technologies to improve the tracking performance and cope with the HL-LHC environment, which will be severe in terms of occupancy and radiation. The total surface area of silicon in the new pixel system could measure up to 14 m$^2$ , depending on the final layout choice, which is expected to take place in early 2017. Several layout options are being investigated at the moment, including some with novel inclined support structures in the barrel-endcap overlap region and others with very long innermost barrel layers. Forward coverage could be as high as $|\\eta| < 4$. Supporting structures will be ...

  5. The Phase-2 ATLAS ITk Pixel Upgrade

    CERN Document Server

    Flick, Tobias; The ATLAS collaboration

    2016-01-01

    The entire tracking system of the ATLAS experiment will be replaced during the LHC Phase II shutdown (foreseen to take place around 2025) by an all-silicon detector called the “ITk” (Inner Tracker). The pixel detector will comprise the five innermost layers, and will be instrumented with new sensor and readout electronics technologies to improve the tracking performance and cope with the HL-LHC environment, which will be severe in terms of occupancy and radiation. The total surface area of silicon in the new pixel system could measure up to 14 m2, depending on the final layout choice, which is expected to take place in early 2017. Four layout options are being investigated at the moment, two with forward coverage to |eta| < 3.2 and two to |eta| < 4. For each coverage option, a layout with long barrel staves and a layout with novel inclined support structures in the barrel-endcap overlap region are considered. All potential layouts include modules mounted on ring-shaped supports in the endcap regions...

  6. ATLAS rewards two pixel detector suppliers

    CERN Multimedia

    2007-01-01

    Peter Jenni, ATLAS spokesperson, presented the ATLAS supplier award to Herbert Reichl, IZM director, and to Simonetta Di Gioia, from the SELEX company.Two of ATLAS’ suppliers were awarded prizes at a ceremony on Wednesday 13 June attended by representatives of the experiment’s management and of CERN. The prizes went to the Fraunhofer Institut für Zuverlässigkeit und Mikrointegration (IZM) in Berlin and the company SELEX Sistemi Integrati in Rome for the manufacture of modules for the ATLAS pixel detector. SELEX supplied 1500 of the modules for the tracker, while IZM produced a further 1300. The modules, each made up of 46080 channels, form the active part of the ATLAS pixel detector. IZM and SELEX received the awards for the excellent quality of their work: the average number of faulty channels per module was less than 2.10-3. They also stayed within budget and on schedule. The difficulty they faced was designing modules based on electronic components and sensor...

  7. Thin n-in-p planar pixel modules for the ATLAS upgrade at HL-LHC

    Science.gov (United States)

    Savic, N.; Bergbreiter, L.; Breuer, J.; La Rosa, A.; Macchiolo, A.; Nisius, R.; Terzo, S.

    2017-02-01

    The ATLAS experiment will undergo a major upgrade of the tracker system in view of the high luminosity phase of the LHC (HL-LHC) foreseen to start around 2025. Thin planar pixel modules are promising candidates to instrument the new pixel system, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. New designs of the pixel cells, with an optimized biasing structure, have been implemented in n-in-p planar pixel productions with sensor thicknesses of 270 μm. Using beam tests, the gain in hit efficiency is investigated as a function of the received irradiation fluence. The outlook for future thin planar pixel sensor productions will be discussed, with a focus on thin sensors with a thickness of 100 and 150 μm and a novel design with the optimized biasing structure and small pixel cells (50×50 and 25×100 μm2). These dimensions are foreseen for the new ATLAS read-out chip in 65 nm CMOS technology and the fine segmentation will represent a challenge for the tracking in the forward region of the pixel system at HL-LHC. To predict the performance of 50×50 μm2 pixels at high η, FE-I4 compatible planar pixel sensors have been studied before and after irradiation in beam tests at high incidence angle with respect to the short pixel direction. Results on cluster shapes, charge collection- and hit efficiency will be shown.

  8. Silicon pixel detector prototyping in SOI CMOS technology

    Science.gov (United States)

    Dasgupta, Roma; Bugiel, Szymon; Idzik, Marek; Kapusta, Piotr; Kucewicz, Wojciech; Turala, Michal

    2016-12-01

    The Silicon-On-Insulator (SOI) CMOS is one of the most advanced and promising technology for monolithic pixel detectors design. The insulator layer that is implemented inside the silicon crystal allows to integrate sensors matrix and readout electronic on a single wafer. Moreover, the separation of electronic and substrate increases also the SOI circuits performance. The parasitic capacitances to substrate are significantly reduced, so the electronic systems are faster and consume much less power. The authors of this presentation are the members of international SOIPIX collaboration, that is developing SOI pixel detectors in 200 nm Lapis Fully-Depleted, Low-Leakage SOI CMOS. This work shows a set of advantages of SOI technology and presents possibilities for pixel detector design SOI CMOS. In particular, the preliminary results of a Cracow chip are presented.

  9. Performance of the INTPIX6 SOI pixel detector

    Science.gov (United States)

    Arai, Y.; Bugiel, Sz.; Dasgupta, R.; Idzik, M.; Kapusta, P.; Kucewicz, W.; Miyoshi, T.; Turala, M.

    2017-01-01

    Characterization of the monolithic pixel detector INPTIX6, designed at KEK and fabricated in Lapis 0.2 μ m Fully-Depleted, Low-Leakage Silicon-On-Insulator (SOI) CMOS technology, was performed. The INTPIX6 comprises a large area of 1408 × 896 integrating type squared pixels of 12 micron pitch. In this work the performance and measurement results of the prototypes produced on lower resistivity Czochralski type (CZ-n) and high resistivity floating zone (FZ-n) sensor wafers are presented. Using 241Am radioactive source the noise of INTPIX6 was measured, showing the ENC (Equivalent Noise Charge) of about 70 e-. The resolution calculated from the FWHM of the Iron-55 X-ray peak was about 100 e-. The radiation hardness of the SOI pixel detector was also investigated. The CZ-n type INTPIX6 received a dose of 60 krad and its performance has been continuously monitored during the irradiation.

  10. Online calibrations and performance of the ATLAS Pixel Detector

    CERN Document Server

    Keil, M; The ATLAS collaboration

    2010-01-01

    The ATLAS Pixel Detector is the innermost detector of the ATLAS experiment at the Large Hadron Collider at CERN. It consists of 1744 silicon sensors equipped with approximately 80 M electronic channels, providing typically three measurement points with high resolution for particles emerging from the beam-interaction region, thus allowing measuring particle tracks and secondary vertices with very high precision. The readout system of the Pixel Detector is based on a bi-directional optical data transmission system between the detector and the data acquisition system with an individual link for each of the 1744 modules. Signal conversion components are located on both ends, approximately 80 m apart. The talk will give an overview of the calibration and performance of both the detector and its optical readout. The most basic parameter to be tuned and calibrated for the detector electronics is the readout threshold of the individual pixel channels. These need to be carefully tuned to optimise position resolution a...

  11. Simulation of Caliste-SO single pixel response

    Science.gov (United States)

    Barylak, J.; Barylak, A.; Mrozek, T.; Podgórski, P.; Steślicki, M.; Ścisłowski, D.

    2016-09-01

    The paper presents a method for determining the pixel response using Geant4 package. The response is calculated for cadmium telluride sensor of Caliste-SO detector. Caliste-SO will be used in STIX instrument on board Solar Orbiter, which is M-class mission of the ESA's program Cosmic Vision 2015-2025. Solar Orbiter is to be launched in October 2018. STIX instrument will provide imaging spectroscopy of solar hard X-ray emissions (4 - 150 keV) using a Fourier-imaging technique. Response of pixels in pixelized Caliste-SO detector vary between each other due to different sizes and locations. This can influence the scientific data obtained from STIX. Additionally, in the simulation we considered detector effects, like: hole tailing, damage layer, Fano and electronic noise.

  12. Detector Modules for the CMS Pixel Phase 1 Upgrade

    CERN Document Server

    Zhu, De Hua; Berger, Pirmin; Meinhard, Maren Tabea; Starodumov, Andrey; Tavolaro, Vittorio Raoul

    2017-01-01

    The CMS Pixel phase 1 upgrade detector consists of 1184 modules with new design. An important part of the production is the module qualification and calibration, ensuring their proper functionality within the detector. This paper summarizes the qualification and calibration results of modules used in the innermost two detector layers with focus on methods using module-internal calibration signals. Extended characterizations on pixel level such as electronic noise and bump bond connectivity, optimization of operational parameters, sensor quality and thermal stress resistance were performed using a customized setup with controlled environment. It could be shown that the selected modules have on average $0.55 \\mathrm{ {}^{0\\!}\\!/\\!_{00} }\\, \\pm \\, 0.01 \\mathrm{ {}^{0\\!}\\!/\\!_{00} }\\,$ defective pixels and that all performance parameters stay within their specifications.

  13. Silicon buried channels for pixel detector cooling

    Energy Technology Data Exchange (ETDEWEB)

    Boscardin, M., E-mail: boscardi@fbk.eu [Fondazione Bruno Kessler Trento, Via Sommarive 18, I-38123 Trento (Italy); Conci, P.; Crivellari, M.; Ronchin, S. [Fondazione Bruno Kessler Trento, Via Sommarive 18, I-38123 Trento (Italy); Bettarini, S. [Universitá di Pisa, L.go B. Pontecorvo 3, I-56127 Pisa (Italy); Istituto Nazionale di Fisica Nucleare, Sez. di Pisa, L.go B. Pontecorvo 3, I-56127 Pisa (Italy); Bosi, F. [Istituto Nazionale di Fisica Nucleare, Sez. di Pisa, L.go B. Pontecorvo 3, I-56127 Pisa (Italy)

    2013-08-01

    The support and cooling structures add important contributions to the thickness, in radiation length, of vertex detectors. In order to minimize the material budget of pixel sensors, we developed a new approach to integrate the cooling into the silicon devices. The microchannels are formed in silicon using isotropic SF{sub 6} plasma etching in a DRIE (deep reactive ion etcher) equipment. Due to their peculiar profiles, the channels can be sealed by a layer of a PECVD silicon oxide. We have realized on a silicon wafer microchannels with different geometries and hydraulic diameters. We describe the main fabrication steps of microchannels with focus on the channel definition. The experimental results are reported on the thermal characterization of several prototypes, using a mixture of glycol and water as a liquid coolant. The prototypes have shown high cooling efficiency and high-pressure breaking strength.

  14. Luminescent properties of [UO{sub 2}(TFA){sub 2}(DMSO){sub 3}], a promising material for sensing and monitoring the uranyl ion

    Energy Technology Data Exchange (ETDEWEB)

    Martin-Ramos, Pablo; Silva, Manuela Ramos; Silva, Pedro S. Pereira da [Centro de Fisica da Universidade de Coimbra (CFisUC), Department of Physics, Universidade de Coimbra (Portugal); Costa, Ana L.; Melo, J. Sergio Seixas de [Centro de Quimica de Coimbra, Department of Chemistry, Universidade de Coimbra (Portugal); Pereira, Laura C.J. [Centro de Ciencias e Tecnologias Nucleares, Instituto Superior Tecnico, Universidade de Lisboa, Bobadela LRS (Portugal); Martin-Gil, Jesus, E-mail: pmr@unizar.es [Advanced Materials Laboratory, Escuela Tecnica Superior de Ingenierias Agrarias, University of Valladolid, Palencia (Spain)

    2016-03-15

    An uranyl complex [UO{sub 2}(TFA){sub 2}(DMSO){sub 3}] (TFA=deprotonated trifluoroacetic acid; DMSO=dimethyl sulfoxide) has been successfully synthesized by reacting UO{sub 2}(CH{sub 3}COO){sub 2} ·H{sub 2} O with one equivalent of (CF{sub 3} CO){sub 2} O and DMSO. The complex has been characterized by single-crystal X-ray diffraction, X-ray powder diffraction, elemental analysis, FTIR spectroscopy, thermal analysis and absorption and emission spectroscopies. The spectroscopic properties of the material make it suitable for its application in the sensing and monitoring of uranyl in the PUREX process. (author)

  15. Faceting of (001) CeO{sub 2} Films: The Road to High Quality TFA-YBa{sub 2}Cu{sub 3}O{sub 7} Multilayers

    Energy Technology Data Exchange (ETDEWEB)

    Coll, M [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Gazquez, J [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Sandiumenge, F [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Pomar, A [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Puig, T [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Obradors, X [Institut de Ciencia de Materials de Barcelona, C.S.I.C., Campus U.A.Barcelona, 08193 Bellaterra (Spain); Espinos, J P [Instituto de Ciencia de Materiales de Sevilla, C.S.I.C., Avda. Americo Vespucio s/n Isla de la Cartuja, 41092 Sevilla (Spain); Gonzalez-Elipe, A R [Instituto de Ciencia de Materiales de Sevilla, C.S.I.C., Avda. Americo Vespucio s/n Isla de la Cartuja, 41092 Sevilla (Spain)

    2006-06-01

    CeO{sub 2} films are technologically important as a buffer layer for the integration of superconducting YBa{sub 2}Cu{sub 3}O{sub 7} films on biaxially textured Ni substrates. The growth of YBa{sub 2}Cu{sub 3}O{sub 7} layers on the CeO{sub 2} cap layers by the trifluoroacetate (TFA) route remains a critical issue. To improve the accommodation of YBa{sub 2}Cu{sub 3}O{sub 7} on CeO{sub 2}, surface conditioning or CeO{sub 2} is required. In this work we have applied ex-situ post-processes at different atmospheres to the CeO{sub 2} layers deposited on YSZ single crystals using rf sputtering. XPS analysis showed that post-annealing CeO{sub 2} layer in Ar/H{sub 2}/H{sub 2}O catalyses in an unexpected way the growth of (001)- terraces. We also report on the growth conditions of YBa{sub 2}Cu{sub 3}O{sub 7}-TFA on CeO{sub 2} buffered YSZ single crystal grown by chemical solution deposition and we compare them with those leading to optimized YBa{sub 2}Cu{sub 3}O{sub 7}-TFA films on LaAlO{sub 3} single crystals. Critical currents up to 1.6 MA/cm{sup 2} at 77 K have been demonstrated in 300 nm thick YBa{sub 2}Cu{sub 3}O{sub 7} layers on CeO{sub 2}/YSZ system. The optimized processing conditions have then been applied to grow YBa{sub 2}Cu{sub 3}O{sub 7}-TFA films on Ni substrates having vacuum deposited cap layers of CeO{sub 2}.

  16. Raman spectroscopic study of YBCO thin films prepared by TFA-MOD%采用MOD法在LAO上制备YBCO超导薄膜的Raman光谱研究

    Institute of Scientific and Technical Information of China (English)

    王连红; 李弢; 古宏伟

    2009-01-01

    研究了TFA-MOD法在铝酸镧基体上制备YBCO超导薄膜时不同初始热处理温度对薄膜的影响.通过 XRD、Raman光谱和SEM等手段,对生长过程中的YBCO超导薄膜结构进行表征、分析,探讨了YBCO的生长机制.

  17. An EUDET/AIDA Pixel Beam Telescope for Detector Development

    CERN Document Server

    Perrey, Hanno

    2013-01-01

    A high resolution ($\\sigma 2 \\sim \\mu$) beam telescope based on monolithic active pixel sensors (MAPS) was developed within the EUDET collaboration. The telescope consists of six sensor planes using Mimosa26 MAPS with a pixel pitch of $18.4 \\mu$ and thinned down to $50 \\mu$. The excellent resolution, readout rate and DAQ integration capabilities made the telescope a primary test beam tool for many groups including several CERN based experiments. Within the new European detector infrastructure project AIDA the test beam telescope will be further extended in terms of cooling infrastructure, readout speed and precision. In order to provide a system optimized for the different requirements by the user community, a combination of various pixel technologies is foreseen. In this report the design of this even more flexible telescope with three different pixel technologies (TimePix, Mimosa, ATLAS FE-I4) will be presented. First test beam results with the HitOR signal provided by the FE-I4 integrated into the trigger...

  18. An EUDET/AIDA Pixel Beam Telescope for Detector Development

    CERN Document Server

    Rubinskiy, I

    2015-01-01

    A high resolution (σ∼2μm) beam telescope based on monolithic active pixel sensors (MAPS) was developed within the EUDET collaboration. The telescope consists of six monolithic active pixel sensor planes (Mimosa26) with a pixel pitch of 18.4 \\mu m and thinned down to 50 \\mu m. The excellent resolution, readout rate and DAQ integration capabilities made the telescope a primary test beam tool for many groups including several CERN based experiments. Within the European detector infrastructure project AIDA the test beam telescope is being further extended in terms of cooling and powering infrastructure, read-out speed, area of acceptance, and precision. In order to provide a system optimized for the different requirements by the user community a combination of various state-of-the-art pixel technologies is foreseen. Furthermore, new central dead-time-free trigger logic unit (TLU) has been developed to provide LHC-speed response with one-trigger-per-particle operating mode and a synchronous clock for all conn...

  19. Electron imaging with Medipix2 hybrid pixel detector

    CERN Document Server

    McMullan, G; Chen, S; Henderson, R; Llopart, X; Summerfield, C; Tlustos, L; Faruqi, A R

    2007-01-01

    The electron imaging performance of Medipix2 is described. Medipix2 is a hybrid pixel detector composed of two layers. It has a sensor layer and a layer of readout electronics, in which each 55 μm×55 μm pixel has upper and lower energy discrimination and MHz rate counting. The sensor layer consists of a 300 μm slab of pixellated monolithic silicon and this is bonded to the readout chip. Experimental measurement of the detective quantum efficiency, DQE(0) at 120 keV shows that it can reach 85% independent of electron exposure, since the detector has zero noise, and the DQE(Nyquist) can reach 35% of that expected for a perfect detector (4/π2). Experimental measurement of the modulation transfer function (MTF) at Nyquist resolution for 120 keV electrons using a 60 keV lower energy threshold, yields a value that is 50% of that expected for a perfect detector (2/π). Finally, Monte Carlo simulations of electron tracks and energy deposited in adjacent pixels have been performed and used to calculate expected v...

  20. An EUDET/AIDA Pixel Beam Telescope for Detector Development

    CERN Document Server

    Rubinskiy, I

    2015-01-01

    Ahigh resolution(σ< 2 μm) beam telescope based on monolithic active pixel sensors (MAPS) was developed within the EUDET collaboration. EUDET was a coordinated detector R&D programme for the future International Linear Collider providing test beam infrastructure to detector R&D groups. The telescope consists of six sensor planes with a pixel pitch of either 18.4 μm or 10 μmand canbe operated insidea solenoidal magnetic fieldofupto1.2T.Ageneral purpose cooling, positioning, data acquisition (DAQ) and offine data analysis tools are available for the users. The excellent resolution, readout rate andDAQintegration capabilities made the telescopea primary beam tests tool also for several CERN based experiments. In this report the performance of the final telescope is presented. The plans for an even more flexible telescope with three differentpixel technologies(ATLASPixel, Mimosa,Timepix) withinthenew European detector infrastructure project AIDA are presented.

  1. Online Calibration and Performance of the ATLAS Pixel Detector

    CERN Document Server

    Keil, M

    2011-01-01

    The ATLAS Pixel Detector is the innermost detector of the ATLAS experiment at the Large Hadron Collider at CERN. It consists of 1744 silicon sensors equipped with approximately 80 million electronic channels, providing typically three measurement points with high resolution for particles emerging from the beam-interaction region, thus allowing measuring particle tracks and secondary vertices with very high precision. The readout system of the Pixel Detector is based on a bi-directional optical data transmission system between the detector and the data acquisition system with an individual link for each of the 1744 modules. Signal conversion components are located on both ends, approximately 80 m apart. This paper describes the tuning and calibration of the optical links and the detector modules, including measurements of threshold, noise, charge measurement, timing performance and the sensor leakage current.

  2. Module and electronics developments for the ATLAS ITK pixel system

    CERN Document Server

    Munoz Sanchez, Francisca Javiela; The ATLAS collaboration

    2017-01-01

    The ATLAS experiment is preparing for an extensive modification of its detectors in the course of the planned HL-LHC accelerator upgrade around 2025. The ATLAS upgrade includes the replacement of the entire tracking system by an all-silicon detector (Inner Tracker, ITk). The five innermost layers of ITk will be a pixel detector built of new sensor and readout electronics technologies to improve the tracking performance and cope with the severe HL-LHC environment in terms of occupancy and radiation. The total area of the new pixel system could measure up to 14 m2, depending on the final layout choice, which is expected to take place in 2017. In this paper an overview of the ongoing R\\&D activities on modules and electronics for the ATLAS ITk is given including the main developments and achievements in silicon planar and 3D sensor technologies, readout and power challenges.

  3. Signal variations in high granularity Si pixel detectors

    CERN Document Server

    Tlustos, L; Heijne, Erik H M; Llopart-Cudie, Xavier

    2004-01-01

    Fixed pattern noise is one of the limiting factors of image quality and degrades the achievable spatial resolution. In the case of silicon sensors non-uniformities due to doping inhomogeneities can be limited by operating the sensor in strong overdepletion. For high granularity photon counting pixel detectors an additional high frequency interpixel signal variation is an important factor for the achievable signal to noise ratio (SNR). It is common practice to apply flatfield corrections to increase the SNR of the detector system. For the case of direct conversion detectors it can be shown that the Poisson limit can be reached for floodfield irradiation. However when used for imaging with spectral X-ray sources flatfield corrections are less effective. This is partly a consequence of charge sharing between adjacent pixels, which gives rise to an effective energy spectrum seen by the readout, which is different from the spectral content of the incident beam. In this paper we present simulations and measurements...

  4. CMS Pixel Detector design for HL-LHC

    CERN Document Server

    Migliore, Ernesto

    2016-01-01

    The LHC machine is planning an upgrade program which will smoothly bring the luminosity to about 7.5$\\times$10$^{34}$cm$^{-2}$s$^{-1}$ in 2028, to possibly reach an integrated luminosity of 3000 fb$^{-1}$ by the end of 2037. This High Luminosity scenario, HL-LHC, will present new challenges in higher data rates and increased radiation.In order to maintain its physics reach the CMS Collaboration has undertaken a preparation program of the detector known as Phase-2 upgrade. The CMS Phase-2 Pixel upgrade will require a high bandwidth readout system and high radiation tolerance for sensors and on-detector ASICs. Several technologies for the upgrade sensors are being studied. Serial powering schemes are under consideration to accommodate significant constraints on the system. These prospective designs, as well as new layout geometries that include very forward pixel discs, will be presented together with performance estimations.

  5. Pixel detector system development at Diamond Light Source

    Science.gov (United States)

    Marchal, J.; Horswell, I.; Gimenez, E. N.; Tartoni, N.

    2010-10-01

    Hybrid pixel detectors consisting of an array of silicon photodiodes bump-bonded to CMOS read-out chips provide high signal-to-noise ratio and high dynamic range compared to CCD-based detectors and Image Plates. These detector features are important for SAXS experiments where a wide range of intensities are present in the images. For time resolved SAXS experiments, high frame rates are compulsory. The latest CMOS read-out chip developed by the MEDIPIX collaboration provides high frame rate and continuous acquisition mode. A read-out system for an array of MEDIPIX3 sensors is under development at Diamond Light Source. This system will support a full resolution frame rate of 1 kHz at a pixel counter depth of 12-bit and a frame rate of 30 kHz at a counter depth of 1 bit. Details concerning system design and MEDIPIX sensors characterization are presented.

  6. CMS Pixel Detector design for HL-LHC

    Science.gov (United States)

    Migliore, E.

    2016-12-01

    The LHC machine is planning an upgrade program which will smoothly bring the luminosity to about 7.5×1034cm-2s-1 in 2028, to possibly reach an integrated luminosity of 3000 fb-1 by the end of 2037. This High Luminosity scenario, HL-LHC, will present new challenges in higher data rates and increased radiation. In order to maintain its physics reach the CMS collaboration has undertaken a preparation program of the detector known as Phase-2 upgrade. The CMS Phase-2 Pixel upgrade will require a high bandwidth readout system and high radiation tolerance for sensors and on-detector ASICs. Several technologies for the upgrade sensors are being studied. Serial powering schemes are under consideration to accommodate significant constraints on the system. These prospective designs, as well as new layout geometries that include very forward pixel discs, will be presented together with performance estimation.

  7. TFA'Expo Exhibition on the next low level radioactive wastes storage center Andra - Aube Center. January - june 2003; TFA'Expo exposition sur le futur Centre de stockage de dechets de tres faible activite Andra - Centre de l'Aube. Janvier - Juin 2003

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2003-07-01

    In order to inform the public on the nuclear installations, the Andra this document on the next storage Center of the Aube, for the low level radioactive wastes. The six parts present, the wastes characteristics, the wastes management, the choice of the site, the organization of the TFA (very low activity wastes), the environmental impacts and the economical impacts. (A.L.B.)

  8. Low noise pixel detectors based on gated geiger mode avalanche photodiodes

    OpenAIRE

    Vilella Figueras, Eva; Comerma Montells, Albert; Alonso Casanovas, Oscar; Diéguez Barrientos, Àngel

    2011-01-01

    The gated operation is proposed as an effective method to reduce the noise in pixel detectors based on Geiger mode avalanche photodiodes. A prototype with the sensor and the front-end electronics monolithically integrated has been fabricated with a conventional HV-CMOS process. Experimental results demonstrate the increase of the dynamic range of the sensor by applying this technique.

  9. Cluster Properties and Lorentz Angle Measurement in the 4-Layer Pixel Detector Using Cosmic Rays

    CERN Document Server

    The ATLAS collaboration

    2015-01-01

    The 4-layer Pixel Detector with the recently installed innermost layer called IBL saw its first data during the 2014 fall cosmic run. This note shows cluster properties and Lorentz angle fits for IBL sensors as well as old barrel layer sensors.

  10. WFC3 Pixel Area Maps

    Science.gov (United States)

    Kalirai, J. S.; Cox, C.; Dressel, L.; Fruchter, A.; Hack, W.; Kozhurina-Platais, V.; Mack, J.

    2010-04-01

    We present the pixel area maps (PAMs) for the WFC3/UVIS and WFC3/IR detectors, and discuss the normalization of these images. HST processed flt images suffer from geometric distortion and therefore have pixel areas that vary on the sky. The counts (electrons) measured for a source on these images depends on the position of the source on the detector, an effect that is implicitly corrected when these images are multidrizzled into drz files. The flt images can be multiplied by the PAMs to yield correct and uniform counts for a given source irrespective of its location on the image. To ensure consistency between the count rate measured for sources in drz images and near the center of flt images, we set the normalization of the PAMs to unity at a reference pixel near the center of the UVIS mosaic and IR detector, and set the SCALE in the IDCTAB equal to the square root of the area of this reference pixel. The implications of this choice for photometric measurements are discussed.

  11. VNR CMS Pixel detector replacement

    CERN Document Server

    2017-01-01

    Joel Butler, spokesperson of the CMS collaboration explains how a team from many different partner institutes installed a new detector in CMS. This detector is the silicon pixel detector and they’ve been working on it for about five years, to replace one of our existing detectors. This detectors measures particles closer to the beam than any of the other components of this huge detector behind me. It gives us the most precise picture of tracks as they come out of the collisions and expand and travel through the detector. This particular device has twice as many pixels, 120 million, as opposed to about 68 million in the old detector and it can take data faster and pump it out to the analysis more quickly. 00’53’’ Images of the descent, insertion and installation of first piece of the Pixel detector on Tue Feb 28. Images of the descent, insertion and installation of second piece of the Pixel and the two cylinders being joined.

  12. Operational experience of ATLAS SCT and Pixel Detector

    CERN Document Server

    Kocian, Martin; The ATLAS collaboration

    2017-01-01

    The ATLAS Inner Detector based on silicon sensors is consisting of a strip detector (SCT) and a pixel detector. It is the crucial component for vertexing and tracking in the ATLAS experiment. With the excellent performance of the LHC well beyond the original specification the silicon tracking detectors are facing substantial challenges in terms of data acquisition, radiation damage to the sensors, and SEUs in the readout ASICs. The approaches on how the detector systems cope with the demands of high luminosity operation while maintaining excellent performance through hardware upgrades, software and firmware algorithms, and operational settings, are presented.

  13. Pixel readout ASIC for an APD based 2D X-ray hybrid pixel detector with sub-nanosecond resolution

    Energy Technology Data Exchange (ETDEWEB)

    Thil, Ch., E-mail: christophe.thil@ziti.uni-heidelberg.d [Heidelberg University, Institute of Computer Engineering, B6, 26, 68161 Mannheim (Germany); Baron, A.Q.R. [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Fajardo, P. [ESRF, Polygone Scientifique Louis Neel, 6, rue Jules Horowitz, 38000 Grenoble (France); Fischer, P. [Heidelberg University, Institute of Computer Engineering, B6, 26, 68161 Mannheim (Germany); Graafsma, H. [DESY, Notkestrasse 85, 22607 Hamburg (Germany); Rueffer, R. [ESRF, Polygone Scientifique Louis Neel, 6, rue Jules Horowitz, 38000 Grenoble (France)

    2011-02-01

    The fast response and the short recovery time of avalanche photodiodes (APDs) in linear mode make those devices ideal for direct X-ray detection in applications requiring high time resolution or counting rate. In order to provide position sensitivity, the XNAP project aims at creating a hybrid pixel detector with nanosecond time resolution based on a monolithic APD sensor array with 32 x32 pixels covering about 1 cm{sup 2} active area. The readout is implemented in a pixelated front-end ASIC suited for the readout of such arrays, matched to pixels of 280{mu}mx280{mu}m size. Every single channel features a fast transimpedance amplifier, a discriminator with locally adjustable threshold and two counters with high dynamic range and counting speed able to accumulate X-ray hits with no readout dead time. Additionally, the detector can be operated in list mode by time-stamping every single event with sub-nanosecond resolution. In a first phase of the project, a 4x4 pixel test module is built to validate the conceptual design of the detector. The XNAP project is briefly presented and the performance of the readout ASIC is discussed.

  14. 3D track reconstruction capability of a silicon hybrid active pixel detector

    Science.gov (United States)

    Bergmann, Benedikt; Pichotka, Martin; Pospisil, Stanislav; Vycpalek, Jiri; Burian, Petr; Broulim, Pavel; Jakubek, Jan

    2017-06-01

    Timepix3 detectors are the latest generation of hybrid active pixel detectors of the Medipix/Timepix family. Such detectors consist of an active sensor layer which is connected to the readout ASIC (application specific integrated circuit), segmenting the detector into a square matrix of 256 × 256 pixels (pixel pitch 55 μm). Particles interacting in the active sensor material create charge carriers, which drift towards the pixelated electrode, where they are collected. In each pixel, the time of the interaction (time resolution 1.56 ns) and the amount of created charge carriers are measured. Such a device was employed in an experiment in a 120 GeV/c pion beam. It is demonstrated, how the drift time information can be used for "4D" particle tracking, with the three spatial dimensions and the energy losses along the particle trajectory (dE/dx). Since the coordinates in the detector plane are given by the pixelation ( x, y), the x- and y-resolution is determined by the pixel pitch (55 μm). A z-resolution of 50.4 μm could be achieved (for a 500 μm thick silicon sensor at 130 V bias), whereby the drift time model independent z-resolution was found to be 28.5 μm.

  15. Module and electronics developments for the ATLAS ITK pixel system

    CERN Document Server

    Munoz Sanchez, Francisca Javiela; The ATLAS collaboration

    2017-01-01

    ATLAS is preparing for an extensive modification of its detector in the course of the planned HL-LHC accelerator upgrade around 2025 which includes a replacement of the entire tracking system by an all-silicon detector (Inner Tracker, ITk). The five innermost layers of ITk will comprise of a pixel detector built of new sensor and readout electronics technologies to improve the tracking performance and cope with the severe HL-LHC environment in terms of occupancy and radiation. The total area of the new pixel system could measure up to 14 m2, depending on the final layout choice that is expected to take place in 2017. A new on-detector readout chip is designed in the context of the RD53 collaboration in 65 nm CMOS technology. This paper will present the on-going R&D within the ATLAS ITK project towards the new pixel modules and the off-detector electronics. Planar and 3D sensors are being re-designed with cell sizes of 50x50 or 25x100 μm2, compatible with the RD53 chip. A sensor thickness equal or less th...

  16. Optimization of thin n-in-p planar pixel modules for the ATLAS upgrade at HL-LHC

    Science.gov (United States)

    Macchiolo, A.; Beyer, J.; La Rosa, A.; Nisius, R.; Savic, N.

    2017-01-01

    The ATLAS experiment will undergo around the year 2025 a replacement of the tracker system in view of the high luminosity phase of the LHC (HL-LHC) with a new 5-layer pixel system. Thin planar pixel sensors are promising candidates to instrument the innermost region of the new pixel system, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. The sensors of 50-150 μm thickness, interconnected to FE-I4 read-out chips, have been characterized with radioactive sources and beam tests. In particular active edge sensors have been investigated. The performance of two different versions of edge designs are compared: the first with a bias ring, and the second one where only a floating guard ring has been implemented. The hit efficiency at the edge has also been studied after irradiation at a fluence of 1015 neq/cm2. Highly segmented sensors will represent a challenge for the tracking in the forward region of the pixel system at HL-LHC. In order to reproduce the performance of 50x50 μm2 pixels at high pseudo-rapidity values, FE-I4 compatible planar pixel sensors have been studied before and after irradiation in beam tests at high incidence angles with respect to the short pixel direction. Results on the hit efficiency in this configuration are discussed for different sensor thicknesses.

  17. Data acquisition at the front-end of the Mu3e pixel detector

    Energy Technology Data Exchange (ETDEWEB)

    Perrevoort, Ann-Kathrin [Physikalisches Institut, Universitaet Heidelberg (Germany); Collaboration: Mu3e-Collaboration

    2016-07-01

    The Mu3e experiment - searching for the lepton-flavour violating decay of the muon into three electrons at an unprecedented sensitivity of one in 10{sup 16} decays - is based on a pixel tracking detector. The sensors are High-Voltage Monolithic Active Pixel Sensors, a technology which allows for very fast and thin detectors, and thus is an ideal fit for Mu3e where the trajectories of low-momentum electrons at high rates are to be measured. The detector will consist of about 275 million pixels and will be operated at up to 10{sup 9} muon stops per second. Therefore, a fast and trigger-less data readout is required. The pixel sensors feature zero-suppressed data output via high-speed serial links. The data is then buffered and sorted by time on a FPGA on the front-end before being processed to the following readout stage. In this talk, the readout of the Mu3e pixel detector at the front-end is introduced. Furthermore, a first firmware implementation of this concept in a beam telescope consisting of the current pixel sensor prototype MuPix7 is presented.

  18. Gated Geiger mode avalanche photodiode pixels with integrated readout electronics for low noise photon detection

    OpenAIRE

    Vilella Figueras, Eva; Comerma Montells, Albert; Alonso Casanovas, Oscar; Gascón Fora, David; Diéguez Barrientos, Àngel

    2011-01-01

    Avalanche photodiodes operated in the Geiger mode offer a high intrinsic gain as well as an excellent timing accuracy. These qualities make the sensor specially suitable for those applications where detectors with high sensitivity and low timing uncertainty are required. Moreover, they are compatible with standard CMOS technologies, allowing sensor and front-end electronics integration within the pixel cell. However, the sensor suffers from high levels of intrinsic noise, which may lead to er...

  19. Effect of Pixel's Spatial Characteristics on Recognition of Isolated Pixelized Chinese Character.

    Science.gov (United States)

    Yang, Kun; Liu, Shuang; Wang, Hong; Liu, Wei; Wu, Yaowei

    2015-01-01

    The influence of pixel's spatial characteristics on recognition of isolated Chinese character was investigated using simulated prosthestic vision. The accuracy of Chinese character recognition with 4 kinds of pixel number (6*6, 8*8, 10*10, and 12*12 pixel array) and 3 kinds of pixel shape (Square, Dot and Gaussian) and different pixel spacing were tested through head-mounted display (HMD). A captured image of Chinese characters in font style of Hei were pixelized with Square, Dot and Gaussian pixel. Results showed that pixel number was the most important factor which could affect the recognition of isolated pixelized Chinese Chartars and the accuracy of recognition increased with the addition of pixel number. 10*10 pixel array could provide enough information for people to recognize an isolated Chinese character. At low resolution (6*6 and 8*8 pixel array), there were little difference of recognition accuracy between different pixel shape and different pixel spacing. While as for high resolution (10*10 and 12*12 pixel array), the fluctuation of pixel shape and pixel spacing could not affect the performance of recognition of isolated pixelized Chinese Character.

  20. First results on the NA60 pixel telescope in In-In collisions

    CERN Document Server

    Radermacher, E

    2003-01-01

    The NA60 experiment aims at studying the production of prompt dimuons and of open charm with proton and heavy ion beams at the CERN SPS. Downstream of the nuclear targets and inside a 2.5 T dipole magnet a pixel telescope measures all charged tracks, from which some are then matched to muons recorded in the muon spectrometer placed behind a hadron absorber. The high multiplicity of charged particles imposes the use of pixel detectors. The constructed pixel telescope is composed of 16 planes with 96 pixel assemblies in total, made from radiation tolerant ALICE1 LHCb pixel readout chips bonded to pixel sensors. The 8 planes nearest to the target contain 4 pixel assemblies and are followed by 8 planes with 8 assemblies. First successful tests of 3 pixel planes, exposed to Pb-Pb collisions, were performed in October 2002. This paper describes the design and assembly of the complete NA60 pixel telescope and gives an overview of the first results obtained in the first weeks of In-In collisions.

  1. SAR Image Complex Pixel Representations

    Energy Technology Data Exchange (ETDEWEB)

    Doerry, Armin W. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2015-03-01

    Complex pixel values for Synthetic Aperture Radar (SAR) images of uniform distributed clutter can be represented as either real/imaginary (also known as I/Q) values, or as Magnitude/Phase values. Generally, these component values are integers with limited number of bits. For clutter energy well below full-scale, Magnitude/Phase offers lower quantization noise than I/Q representation. Further improvement can be had with companding of the Magnitude value.

  2. Pre- and post-irradiation performance of FBK 3D silicon pixel detectors for CMS

    Energy Technology Data Exchange (ETDEWEB)

    Krzywda, A., E-mail: akrzywda@purdue.edu [Purdue University, Department of Physics and Astronomy, West Lafayette, IN 47907-2036 (United States); Alagoz, E.; Bubna, M. [Purdue University, Department of Physics and Astronomy, West Lafayette, IN 47907-2036 (United States); Obertino, M. [Università del Piemonte Orientale, Novara (Italy); INFN, Sezione di Torino, Torino (Italy); Solano, A. [Università di Torino, Torino (Italy); INFN, Sezione di Torino, Torino (Italy); Arndt, K. [Purdue University, Department of Physics and Astronomy, West Lafayette, IN 47907-2036 (United States); Uplegger, L. [Fermi National Accelerator Laboratory, Batavia, IL 60510-5011 (United States); Betta, G.F. Dalla [TIFPA INFN and Dipartimento di Ingegneria Industriale, Università di Trento, Via Sommarive 9, I-38123 Povo di Trento, TN (Italy); Boscardin, M. [Centro per Materiali e i Microsistemi Fondazione Bruno Kessler (FBK), Trento, Via Sommarive 18, I-38123 Povo di Trento, TN (Italy); Ngadiuba, J. [Università di Milano-Bicocca, Milan (Italy); Rivera, R. [Fermi National Accelerator Laboratory, Batavia, IL 60510-5011 (United States); Menasce, D.; Moroni, L.; Terzo, S. [Università di Milano-Bicocca, Milan (Italy); Bortoletto, D. [Purdue University, Department of Physics and Astronomy, West Lafayette, IN 47907-2036 (United States); Prosser, A.; Adreson, J.; Kwan, S. [Fermi National Accelerator Laboratory, Batavia, IL 60510-5011 (United States); Osipenkov, I. [Texas A and M University, Department of Physics, College Station, TX 77843 (United States); Bolla, G. [Purdue University, Department of Physics and Astronomy, West Lafayette, IN 47907-2036 (United States); and others

    2014-11-01

    In preparation for the tenfold luminosity upgrade of the Large Hadron Collider (the HL-LHC) around 2020, three-dimensional (3D) silicon pixel sensors are being developed as a radiation-hard candidate to replace the planar ones currently being used in the CMS pixel detector. This study examines an early batch of FBK sensors (named ATLAS08) of three 3D pixel geometries: 1E, 2E, and 4E, which respectively contain one, two, and four readout electrodes for each pixel, passing completely through the bulk. We present electrical characteristics and beam test performance results for each detector before and after irradiation. The maximum fluence applied is 3.5×10{sup 15} n {sub eq}/cm{sup 2}.

  3. Performance of the Pixel Luminosity Telescope for Luminosity Measurement at CMS during Run 2

    CERN Document Server

    CMS Collaboration

    2017-01-01

    The Pixel Luminosity Telescope (PLT) is a dedicated system for luminosity measurement at the CMS experiment using silicon pixel sensors arranged into "telescopes", each consisting of three planes. It was installed during LS1 at the beginning of 2015 and has been providing online and offline luminosity measurements throughout Run 2. The online bunch-by-bunch luminosity measurement employs the "fast-or" capability of the pixel readout chip (PSI46) to identify events where a hit is registered in all three sensors in a telescope corresponding primarily to tracks originating from the interaction point. In addition, the full pixel information is read out at a lower rate, allowing for the calculation of corrections to the online luminosity from effects such as the miscounting of tracks not originating from the interaction point and detector efficiency. In this talk, we will present results from 2016 running and preliminary 2017 results, including commissioning and operational history, luminosity calibration using Va...

  4. Small-Scale Readout System Prototype for the STAR PIXEL Detector

    Energy Technology Data Exchange (ETDEWEB)

    Szelezniak, Michal; Anderssen, Eric; Greiner, Leo; Matis, Howard; Ritter, Hans Georg; Stezelberger, Thorsten; Sun, Xiangming; Thomas, James; Vu, Chinh; Wieman, Howard

    2008-10-10

    Development and prototyping efforts directed towards construction of a new vertex detector for the STAR experiment at the RHIC accelerator at BNL are presented. This new detector will extend the physics range of STAR by allowing for precision measurements of yields and spectra of particles containing heavy quarks. The innermost central part of the new detector is a high resolution pixel-type detector (PIXEL). PIXEL requirements are discussed as well as a conceptual mechanical design, a sensor development path, and a detector readout architecture. Selected progress with sensor prototypes dedicated to the PIXEL detector is summarized and the approach chosen for the readout system architecture validated in tests of hardware prototypes is discussed.

  5. CMOS pixel development for the ATLAS experiment at HL-LHC

    CERN Document Server

    Rimoldi, Marco; The ATLAS collaboration

    2017-01-01

    To cope with the rate and radiation environment expected at the HL-LHC new approaches are being developed on CMOS pixel detectors, providing charge collection in a depleted layer. They are based on: HV enabling technologies that allow to use high depletion voltages, high resistivity wafers for large depletion depths; radiation hard processed with multiple nested wells to allow CMOS electronics embedded with sufficient shielding into the sensor substrate and backside processing and thinning for material minimization and backside voltage application. Since 2014, members of more than 20 groups in the ATLAS experiment are actively pursuing CMOS pixel R$\\&$D in an ATLAS Demonstrator program pursuing sensor design and characterizations. The goal of this program is to demonstrate that depleted CMOS pixels are suited for high rate, fast timing and high radiation operation at LHC. For this a number of technologies have been explored and characterized. In this presentation the challenges for the usage of CMOS pixel...

  6. Neural network based cluster creation in the ATLAS silicon Pixel Detector

    CERN Document Server

    Perez Cavalcanti, T; The ATLAS collaboration

    2012-01-01

    The hit signals read out from pixels on planar semi-conductor sensors are grouped into clusters, to reconstruct the location where a charged particle passed through. The resolution of the individual pixel sizes can be improved significantly using the information from the cluster of adjacent pixels. Such analog cluster creation techniques have been used by the ATLAS experiment for many years giving an excellent performance. However, in dense environments, such as those inside high-energy jets, is likely that the charge deposited by two or more close-by tracks merges into one single cluster. A new pattern recognition algorithm based on neural network methods has been developed for the ATLAS Pixel Detector. This can identify the shared clusters, split them if necessary, and estimate the positions of all particles traversing the cluster. The algorithm significantly reduces ambiguities in the assignment of pixel detector measurements to tracks within jets, and improves the positional accuracy with respect to stand...

  7. Commissioning of the upgraded ATLAS Pixel Detector for Run2 at LHC

    CERN Document Server

    AUTHOR|(INSPIRE)INSPIRE-00016406

    2016-01-01

    The Pixel Detector of the ATLAS experiment has shown excellent performance during the whole Run-1 of LHC. Taking advantage of the long showdown, the detector was extracted from the experiment and brought to surface, to equip it with new service quarter panels, to repair modules and to ease installation of the Insertable B-Layer (IBL), a fourth layer of pixel detectors, installed in May 2014 between the existing Pixel Detector and a new smaller radius beam-pipe at a radius of 3.3 cm. To cope with the high radiation and pixel occupancy due to the proximity to the interaction point, a new read-out chip and two different silicon sensor technologies (planar and 3D) have been developed. An overview of the refurbishing of the Pixel Detector and of the IBL project as well as early performance tests using cosmic rays and beam data will be presented.

  8. Commissioning of the upgraded ATLAS Pixel Detector for Run2 at LHC

    Energy Technology Data Exchange (ETDEWEB)

    Dobos, Daniel, E-mail: daniel.dobos@cern.ch

    2016-07-11

    The Pixel Detector of the ATLAS experiment has shown excellent performance during the whole Run-1 of LHC. Taking advantage of the long showdown, the detector was extracted from the experiment and brought to the surface, to equip it with new service quarter panels, to repair modules and to ease installation of the Insertable B-Layer, a fourth layer of pixel detectors, installed in May 2014 between the existing Pixel Detector and a new smaller radius beam-pipe at a radius of 3.3 cm. To cope with the high radiation and pixel occupancy due to the proximity to the interaction point, a new read-out chip and two different silicon sensor technologies (planar and 3D) have been developed. An overview of the refurbishing of the Pixel Detector and of the IBL project as well as early performance tests using cosmic rays and beam data will be presented.

  9. CMS has a heart of pixels

    CERN Multimedia

    2003-01-01

    In the immediate vicinity of the collision point, CMS will be equipped with pixel detectors consisting of no fewer than 50 million pixels measuring 150 microns along each side. Each of the pixels, which receive the signal, is connected to its own electronic circuit by a tiny sphere (seen here in the electron microscope image) measuring 15 to 20 microns in diameter.

  10. 1-Methylimidazolium trifluoroacetate [Hmim]Tfa: Mild and efficient Brønsted acidic ionic liquid for Hantzsch reaction under microwave irradiation

    Indian Academy of Sciences (India)

    Jemin R Avalani; Devji S Patel; Dipak K Raval

    2012-09-01

    One pot synthesis of 1,4-dihydropyridine derivatives was achieved via condensation of various -ketoesters with aromatic/aliphatic aldehydes and ammonium acetate. The reaction was catalysed by a stable and reusable Brønsted acidic ionic liquid (IL), 1-methyl-imidazolium trifluoroacetate ([Hmim]Tfa), under microwave (MW) irradiation. The synergistic combination ofMWwith IL can potentially go a long way tomeet the increasing demand for chemical processes. This homogeneous catalytic procedure is simple and efficient. The catalyst can be reused at least four times with almost complete retention in its activity.

  11. Fabrication of long YBCO films on Ag base tape%多晶Ag基带上YBCO超导膜的TFA-MOD制备法

    Institute of Scientific and Technical Information of China (English)

    刘敏; 周美玲; 梁景霞; 高欣; 翟乐恒; 刘丹敏

    2003-01-01

    探讨了三氟乙酸盐受热分解(TFA-MOD)方法在多晶织构Ag基片上制备YBCO膜的工艺参数与薄膜的成分和取向、表面形貌及超导电性之间的关系. 通过优化工艺参数, 在1 cm Ag{110}〈110〉基带上制备了成分单一、纯c-轴取向及较好面内取向的YBCO膜, Tc=90 K, Jc=15 000 A/cm2.

  12. Aerobic dehydrogenation of cyclohexanone to phenol catalyzed by Pd(TFA)2/2-dimethylaminopyridine: evidence for the role of Pd nanoparticles.

    Science.gov (United States)

    Pun, Doris; Diao, Tianning; Stahl, Shannon S

    2013-06-05

    We have carried out a mechanistic investigation of aerobic dehydrogenation of cyclohexanones and cyclohexenones to phenols with a Pd(TFA)2/2-dimethylaminopyridine catalyst system. Numerous experimental methods, including kinetic studies, filtration tests, Hg poisoning experiments, transmission electron microscopy, and dynamic light scattering, provide compelling evidence that the initial Pd(II) catalyst mediates the first dehydrogenation of cyclohexanone to cyclohexenone, after which it evolves into soluble Pd nanoparticles that retain catalytic activity. This nanoparticle formation and stabilization is facilitated by each of the components in the catalytic reaction, including the ligand, TsOH, DMSO, substrate, and cyclohexenone intermediate.

  13. A time-resolved image sensor for tubeless streak cameras

    Science.gov (United States)

    Yasutomi, Keita; Han, SangMan; Seo, Min-Woong; Takasawa, Taishi; Kagawa, Keiichiro; Kawahito, Shoji

    2014-03-01

    This paper presents a time-resolved CMOS image sensor with draining-only modulation (DOM) pixels for tube-less streak cameras. Although the conventional streak camera has high time resolution, the device requires high voltage and bulky system due to the structure with a vacuum tube. The proposed time-resolved imager with a simple optics realize a streak camera without any vacuum tubes. The proposed image sensor has DOM pixels, a delay-based pulse generator, and a readout circuitry. The delay-based pulse generator in combination with an in-pixel logic allows us to create and to provide a short gating clock to the pixel array. A prototype time-resolved CMOS image sensor with the proposed pixel is designed and implemented using 0.11um CMOS image sensor technology. The image array has 30(Vertical) x 128(Memory length) pixels with the pixel pitch of 22.4um. .

  14. Study of Pixel Area Variations in Fully Depleted Thick CCD

    Energy Technology Data Exchange (ETDEWEB)

    Kotov, I.V.; O' Connor, P.; Kotov, A.I.; Frank, J.; Kubanek, P.; Prouza, M.; Radeka, V.; Takacs, P.

    2010-06-30

    Future wide field astronomical surveys, like Large Synoptic Survey Telescope (LSST), require photometric precision on the percent level. The accuracy of sensor calibration procedures should match these requirements. Pixel size variations found in CCDs from different manufacturers are the source of systematic errors in the flat field calibration procedure. To achieve the calibration accuracy required to meet the most demanding science goals this effect should be taken into account. The study of pixel area variations was performed for fully depleted, thick CCDs produced in a technology study for LSST. These are n-channel, 100 {micro}m thick devices. We find pixel size variations in both row and column directions. The size variation magnitude is smaller in the row direction. In addition, diffusion is found to smooth out electron density variations. It is shown that the characteristic diffusion width can be extracted from the flat field data. Results on pixel area variations and diffusion, data features, analysis technique and modeling technique are presented and discussed.

  15. Monolithic pixels on moderate resistivity substrate and sparsifying readout architecture

    CERN Document Server

    Giubilato, P; Snoeys, W; Bisello, D; Marchioro, A; Battaglia, M; Demaria, L; Mansuy, S C; Pantano, D; Rousset, J; Mattiazzo, S; Kloukinas, K; Potenza, A; Ikemoto, Y; Rivetti, A; Chalmet, P; Mugnier, H; Silvestrin, L

    2013-01-01

    The LePix projects aim realizing a new generation monolithic pixel detectors with improved performances at lesser cost with respect to both current state of the art monolithic and hybrid pixel sensors. The detector is built in a 90 nm CMOS process on a substrate of moderate resistivity. This allows charge collection by drift while maintaining the other advantages usually offered by MAPS, like having a single piece detector and using a standard CMOS production line. The collection by drift mechanism, coupled to the low capacitance design of the collecting node made possible by the monolithic approach, provides an excellent signal to noise ratio straight at the pixel cell together with a radiation tolerance far superior to conventional un-depleted MAPS. The excellent signal-to-noise performance is demonstrated by the device ability to separate the 6 keV Fe-55 double peak at room temperature. To achieve high granularity (10-20 mu m pitch pixels) over large detector areas maintaining high readout speed, a complet...

  16. Thin n-in-p planar pixel modules for the ATLAS upgrade at HL-LHC

    CERN Document Server

    INSPIRE-00517212; Breuer, J.; La Rosa, A.; Macchiolo, A.; Nisius, R.; Terzo, S.

    2016-01-01

    The ATLAS experiment will undergo a major upgrade of the tracker system in view of the high luminosity phase of the LHC (HL-LHC) foreseen to start around 2025. Thin planar pixel modules are promising candidates to instrument the new pixel system, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. New designs of the pixel cells, with an optimized biasing structure, have been implemented in n-in-p planar pixel productions with sensor thicknesses of 270 um. Using beam tests, the gain in hit efficiency is investigated as a function of the received irradiation fluence. The outlook for future thin planar pixel sensor productions will be discussed, with a focus on thin sensors with a thickness of 100 and 150 um and a novel design with the optimized biasing structure and small pixel cells (50 um x 50 um and 25 um x 100 um). These dimensions are foreseen for the new ATLAS read-out chip in 65 nm CMOS technology and the fine segmentation will represen...

  17. The Dosepix detector—an energy-resolving photon-counting pixel detector for spectrometric measurements

    CERN Document Server

    Zang, A; Ballabriga, R; Bisello, F; Campbell, M; Celi, J C; Fauler, A; Fiederle, M; Jensch, M; Kochanski, N; Llopart, X; Michel, N; Mollenhauer, U; Ritter, I; Tennert, F; Wölfel, S; Wong, W; Michel, T

    2015-01-01

    The Dosepix detector is a hybrid photon-counting pixel detector based on ideas of the Medipix and Timepix detector family. 1 mm thick cadmium telluride and 300 μm thick silicon were used as sensor material. The pixel matrix of the Dosepix consists of 16 x 16 square pixels with 12 rows of (200 μm)2 and 4 rows of (55 μm)2 sensitive area for the silicon sensor layer and 16 rows of pixels with 220 μm pixel pitch for CdTe. Besides digital energy integration and photon-counting mode, a novel concept of energy binning is included in the pixel electronics, allowing energy-resolved measurements in 16 energy bins within one acquisition. The possibilities of this detector concept range from applications in personal dosimetry and energy-resolved imaging to quality assurance of medical X-ray sources by analysis of the emitted photon spectrum. In this contribution the Dosepix detector, its response to X-rays as well as spectrum measurements with Si and CdTe sensor layer are presented. Furthermore, a first evaluation wa...

  18. ATLAS Pixel Detector Design For HL-LHC

    CERN Document Server

    Smart, Ben; The ATLAS collaboration

    2016-01-01

    The ATLAS Inner Detector will be replaced for the High-Luminosity LHC (HL-LHC) running in 2026. The new Inner Detector will be called the Inner Tracker (ITk). The ITk will cover an extended eta-range: at least to |eta|<3.2, and likely up to |eta|<4.0. The ITk will be an all-Silicon based detector, consisting of a Silicon strip detector outside of a radius of 362mm, and a Silicon pixel detector inside of this radius. Several novel designs are being considered for the ITk pixel detector, to cope with high-eta charged particle tracks. These designs are grouped into 'extended' and 'inclined' design-types. Extended designs have long pixel staves with sensors parallel to the beamline. High-eta particles will therefore hit these sensors at shallow angles, leaving elongated charge clusters. The length of such a charge cluster can be used to estimate the angle of the passing particle. This information can then be used in track reconstruction to improve tracking efficiency and reduce fake rates. Inclined designs ...

  19. ATLAS Pixel Detector Design For HL-LHC

    CERN Document Server

    AUTHOR|(INSPIRE)INSPIRE-00237541; The ATLAS collaboration

    2016-01-01

    The ATLAS Inner Detector will be replaced for the High-Luminosity LHC (HL-LHC) running in 2026. The new Inner Detector will be called the Inner Tracker (ITk). The ITk will cover an extended eta-range: at least to |eta|<3.2, and likely up to |eta|<4.0. The ITk will be an all-Silicon based detector, consisting of a Silicon strip detector outside of a radius of 362 mm, and a Silicon pixel detector inside of this radius. Several novel designs are being considered for the ITk pixel detector, to cope with high-eta charged particle tracks. These designs are grouped into 'extended' and 'inclined' design-types. Extended designs have long pixel staves with sensors parallel to the beamline, while inclined designs have sensors angled such that they point towards the interaction point. The relative advantages and challenges of these two classes of designs will be examined in this paper, along with the mechanical solutions being considered. Thermal management, radiation-length mapping, and electrical services will al...

  20. ATLAS pixel detector design for the HL-LHC

    Science.gov (United States)

    Smart, B.

    2017-02-01

    The ATLAS Inner Detector will be replaced for the High-Luminosity LHC (HL-LHC) running in 2026. The new Inner Detector is called the Inner Tracker (ITk). The ITk will cover an extended η-range: at least to |η|<3.2, and likely up to 0|η|<4.. The ITk will be an all-Silicon based detector, consisting of a Silicon strip detector outside of a radius of 362 mm, and a Silicon pixel detector inside of this radius. Several novel designs are being considered for the ITk pixel detector, to cope with high-eta charged particle tracks. These designs are grouped into `extended' and `inclined' design-types. Extended designs have long pixel staves with sensors parallel to the beamline, while inclined designs have sensors angled such that they point towards the interaction point. The relative advantages and challenges of these two classes of designs will be examined in this paper, along with the mechanical solutions being considered. Thermal management, radiation-length mapping, and electrical services will also be discussed.

  1. High fidelity point-spread function retrieval in the presence of electrostatic, hysteretic pixel response

    CERN Document Server

    Rasmussen, Andrew; Lage, Craig; Antilogus, Pierre; Astier, Pierre; Doherty, Peter; Gilmore, Kirk; Kotov, Ivan; Lupton, Robert; Nomerotski, Andrei; O'Connor, Paul; Stubbs, Christopher; Tyson, Anthony; Walter, Christopher

    2016-01-01

    We employ electrostatic conversion drift calculations to match CCD pixel signal covariances observed in flat field exposures acquired using candidate sensor devices for the LSST Camera. We thus constrain pixel geometry distortions present at the end of integration, based on signal images recorded. We use available data from several operational voltage parameter settings to validate our understanding. Our primary goal is to optimize flux point-spread function (FPSF) estimation quantitatively, and thereby minimize sensor-induced errors which may limit performance in precision astronomy applications. We consider alternative compensation scenarios that will take maximum advantage of our understanding of this underlying mechanism in data processing pipelines currently under development. To quantitatively capture the pixel response in high-contrast/high dynamic range operational extrema, we propose herein some straightforward laboratory tests that involve altering the time order of source illumination on sensors, w...

  2. Development and characterization of a DEPFET pixel prototype system for the ILC vertex detector

    Energy Technology Data Exchange (ETDEWEB)

    Kohrs, Robert

    2008-09-15

    For the future TeV-scale linear collider ILC (International Linear Collider) a vertex detector of unprecedented performance is needed to fully exploit its physics potential. By incorporating a field effect transistor into a fully depleted sensor substrate the DEPFET (Depleted Field Effect Transistor) sensor combines radiation detection and in-pixel amplification. For the operation at a linear collider the excellent noise performance of DEPFET pixels allows building very thin detectors with a high spatial resolution and a low power consumption. With this thesis a prototype system consisting of a 64 x 128 pixels sensor, dedicated steering and readout ASICs and a data acquisition board has been developed and successfully operated in the laboratory and under realistic conditions in beam test environments at DESY and CERN. A DEPFET matrix has been successfully read out using the on-chip zero-suppression of the readout chip CURO 2. The results of the system characterization and beam test results are presented. (orig.)

  3. The LHCb Vertex Locator (VELO) Pixel Detector Upgrade

    CERN Document Server

    Buchanan, Emma

    2017-01-01

    The LHCb experiment is designed to perform high-precision measurements of CP violation and the decays of beauty and charm hadrons at the Large Hadron Collider (LHC) at CERN. There is a planned upgrade during Long Shutdown 2 (LS2), expected in 2019, which will allow the detector to run at higher luminosities by transforming the entire readout to a trigger-less system. This will include a substantial upgrade of the Vertex Locator (VELO), the silicon tracker that surrounds the LHCb interaction region. The VELO is moving from silicon strip technology to hybrid pixel sensors, where silicon sensors are bonded to VeloPix ASICs. Sensor prototypes have undergone rigorous testing using the Timepix3 Telescope at the SPS, CERN. The main components of the upgrade are summarised and testbeam results presented.

  4. Making a trillion pixels dance

    Science.gov (United States)

    Singh, Vivek; Hu, Bin; Toh, Kenny; Bollepalli, Srinivas; Wagner, Stephan; Borodovsky, Yan

    2008-03-01

    In June 2007, Intel announced a new pixelated mask technology. This technology was created to address the problem caused by the growing gap between the lithography wavelength and the feature sizes patterned with it. As this gap has increased, the quality of the image has deteriorated. About a decade ago, Optical Proximity Correction (OPC) was introduced to bridge this gap, but as this gap continued to increase, one could not rely on the same basic set of techniques to maintain image quality. The computational lithography group at Intel sought to alleviate this problem by experimenting with additional degrees of freedom within the mask. This paper describes the resulting pixelated mask technology, and some of the computational methods used to create it. The first key element of this technology is a thick mask model. We realized very early in the development that, unlike traditional OPC methods, the pixelated mask would require a very accurate thick mask model. Whereas in the traditional methods, one can use the relatively coarse approximations such as the boundary layer method, use of such techniques resulted not just in incorrect sizing of parts of the pattern, but in whole features missing. We built on top of previously published domain decomposition methods, and incorporated limitations of the mask manufacturing process, to create an accurate thick mask model. Several additional computational techniques were invoked to substantially increase the speed of this method to a point that it was feasible for full chip tapeout. A second key element of the computational scheme was the comprehension of mask manufacturability, including the vital issue of the number of colors in the mask. While it is obvious that use of three or more colors will give the best image, one has to be practical about projecting mask manufacturing capabilities for such a complex mask. To circumvent this serious issue, we eventually settled on a two color mask - comprising plain glass and etched

  5. Development of n-in-p pixel modules for the ATLAS Upgrade at HL-LHC

    CERN Document Server

    Macchiolo, Anna; Savic, Natascha; Terzo, Stefano

    2016-01-01

    Thin planar pixel modules are promising candidates to instrument the inner layers of the new ATLAS pixel detector for HL-LHC, thanks to the reduced contribution to the material budget and their high charge collection efficiency after irradiation. 100-200 $\\mu$m thick sensors, interconnected to FE-I4 read-out chips, have been characterized with radioactive sources and beam tests at the CERN-SPS and DESY. The results of these measurements are reported for devices before and after irradiation up to a fluence of $14\\times10^{15}$ n$_{eq}$/cm$^2$. The charge collection and tracking efficiency of the different sensor thicknesses are compared. The outlook for future planar pixel sensor production is discussed, with a focus on sensor design with the pixel pitches (50x50 and 25x100 $\\mu$m$^2$) foreseen for the RD53 Collaboration read-out chip in 65 nm CMOS technology. An optimization of the biasing structures in the pixel cells is required to avoid the hit efficiency loss presently observed in the punch-through region...

  6. Urban Image Classification: Per-Pixel Classifiers, Sub-Pixel Analysis, Object-Based Image Analysis, and Geospatial Methods. 10; Chapter

    Science.gov (United States)

    Myint, Soe W.; Mesev, Victor; Quattrochi, Dale; Wentz, Elizabeth A.

    2013-01-01

    Remote sensing methods used to generate base maps to analyze the urban environment rely predominantly on digital sensor data from space-borne platforms. This is due in part from new sources of high spatial resolution data covering the globe, a variety of multispectral and multitemporal sources, sophisticated statistical and geospatial methods, and compatibility with GIS data sources and methods. The goal of this chapter is to review the four groups of classification methods for digital sensor data from space-borne platforms; per-pixel, sub-pixel, object-based (spatial-based), and geospatial methods. Per-pixel methods are widely used methods that classify pixels into distinct categories based solely on the spectral and ancillary information within that pixel. They are used for simple calculations of environmental indices (e.g., NDVI) to sophisticated expert systems to assign urban land covers. Researchers recognize however, that even with the smallest pixel size the spectral information within a pixel is really a combination of multiple urban surfaces. Sub-pixel classification methods therefore aim to statistically quantify the mixture of surfaces to improve overall classification accuracy. While within pixel variations exist, there is also significant evidence that groups of nearby pixels have similar spectral information and therefore belong to the same classification category. Object-oriented methods have emerged that group pixels prior to classification based on spectral similarity and spatial proximity. Classification accuracy using object-based methods show significant success and promise for numerous urban 3 applications. Like the object-oriented methods that recognize the importance of spatial proximity, geospatial methods for urban mapping also utilize neighboring pixels in the classification process. The primary difference though is that geostatistical methods (e.g., spatial autocorrelation methods) are utilized during both the pre- and post

  7. ANALYSIS OF MULTIPATH PIXELS IN SAR IMAGES

    Directory of Open Access Journals (Sweden)

    J. W. Zhao

    2016-06-01

    Full Text Available As the received radar signal is the sum of signal contributions overlaid in one single pixel regardless of the travel path, the multipath effect should be seriously tackled as the multiple bounce returns are added to direct scatter echoes which leads to ghost scatters. Most of the existing solution towards the multipath is to recover the signal propagation path. To facilitate the signal propagation simulation process, plenty of aspects such as sensor parameters, the geometry of the objects (shape, location, orientation, mutual position between adjacent buildings and the physical parameters of the surface (roughness, correlation length, permittivitywhich determine the strength of radar signal backscattered to the SAR sensor should be given in previous. However, it's not practical to obtain the highly detailed object model in unfamiliar area by field survey as it's a laborious work and time-consuming. In this paper, SAR imaging simulation based on RaySAR is conducted at first aiming at basic understanding of multipath effects and for further comparison. Besides of the pre-imaging simulation, the product of the after-imaging, which refers to radar images is also taken into consideration. Both Cosmo-SkyMed ascending and descending SAR images of Lupu Bridge in Shanghai are used for the experiment. As a result, the reflectivity map and signal distribution map of different bounce level are simulated and validated by 3D real model. The statistic indexes such as the phase stability, mean amplitude, amplitude dispersion, coherence and mean-sigma ratio in case of layover are analyzed with combination of the RaySAR output.

  8. The ATLAS tracker Pixel detector for HL-LHC

    CERN Document Server

    Gemme, Claudia; The ATLAS collaboration

    2017-01-01

    The high luminosity upgrade of the LHC (HL-LHC) in 2026 will provide new challenges to the ATLAS tracker. The current Inner Detector will be replaced with a whole silicon tracker which will consist of a five barrel layer Pixel detector surrounded by a four barrel layer Strip detector. The expected high radiation levels are requiring the development of upgraded silicon sensors as well as new a front-end chip. The dense tracking environment will require finer granularity detectors. The data rates will require new technologies for high bandwidth data transmission and handling. The current status of the HL-LHC ATLAS Pixel detector developments as well as the various layout options are reviewed.

  9. Compensation for TID Damage in SOI Pixel Devices

    CERN Document Server

    Tobita, Naoshi; Hara, Kazuhiko; Aoyagi, Wataru; Arai, Yasuo; Miyoshi, Toshinobu; Kurachi, Ikuo; Hatsui, Takaki; Kudo, Togo; Kobayashi, Kazuo

    2015-01-01

    We are investigating adaption of SOI pixel devices for future high energy physic(HEP) experiments. The pixel sensors are required to be operational in very severe radiation environment. Most challenging issue in the adoption is the TID (total ionizing dose) damage where holes trapped in oxide layers affect the operation of nearby transistors. We have introduced a second SOI layer - SOI2 beneath the BOX (Buried OXide) layer - in order to compensate for the TID effect by applying a negative voltage to this electrode to cancel the effect caused by accumulated positive holes. In this paper, the TID effects caused by Co gamma-ray irradiation are presented based on the transistor characteristics measurements. The irradiation was carried out in various biasing conditions to investigate hole accumulation dependence on the potential configurations. We also compare the data with samples irradiated with X-ray. Since we observed a fair agreement between the two irradiation datasets, the TID effects have been investigated...

  10. New SOFRADIR 10μm pixel pitch infrared products

    Science.gov (United States)

    Lefoul, X.; Pere-Laperne, N.; Augey, T.; Rubaldo, L.; Aufranc, Sébastien; Decaens, G.; Ricard, N.; Mazaleyrat, E.; Billon-Lanfrey, D.; Gravrand, Olivier; Bisotto, Sylvette

    2014-10-01

    Recent advances in miniaturization of IR imaging technology have led to a growing market for mini thermal-imaging sensors. In that respect, Sofradir development on smaller pixel pitch has made much more compact products available to the users. When this competitive advantage is mixed with smaller coolers, made possible by HOT technology, we achieved valuable reductions in the size, weight and power of the overall package. At the same time, we are moving towards a global offer based on digital interfaces that provides our customers simplifications at the IR system design process while freeing up more space. This paper discusses recent developments on hot and small pixel pitch technologies as well as efforts made on compact packaging solution developed by SOFRADIR in collaboration with CEA-LETI.

  11. Mechanistic Studies of Wacker-Type Amidocyclization of Alkenes Catalyzed by (IMes)Pd(TFA)2(H2O): Kinetic and Stereochemical Implications of Proton Transfer†

    Science.gov (United States)

    Ye, Xuan; White, Paul B.

    2012-01-01

    The stereochemical course of the amidopalladation of alkenes has important implications for the development of enantioselective Pd-catalyzed “Wacker-type” oxidative amination of alkenes. We have recently shown that the addition of base (Na2CO3) can alter the stereochemical course of amidopalladation in the (IMes)Pd(TFA)2(H2O)-catalyzed aerobic oxidative amidation of alkene. In this study, the mechanism of (IMes)Pd(TFA)2(H2O)-catalyzed oxidative heterocyclization of (Z)-4-hexenyltosylamide was investigated in the presence and absence of exogenous base Na2CO3. The results reveal two parallel pathways in the absence of base: a cis-amidopalladation pathway with turnover-limiting deprotonation of the sulfonamide nucleophile, and a trans-amidopalladation pathway with turnover-limiting nucleophilic attack of sulfonamide on the coordinated alkene. The addition of base (Na2CO3) lowers the energy barrier associated with the proton transfer, leading to an overall faster turnover rate and exclusive cis-amidopalladation of alkene. PMID:23157332

  12. Mechanistic studies of Wacker-type amidocyclization of alkenes catalyzed by (IMes)Pd(TFA)2(H2O): kinetic and stereochemical implications of proton transfer.

    Science.gov (United States)

    Ye, Xuan; White, Paul B; Stahl, Shannon S

    2013-03-01

    The stereochemical course of the amidopalladation of alkenes has important implications for the development of enantioselective Pd-catalyzed "Wacker-type" oxidative amidation of alkenes. We have recently shown that the addition of base (Na2CO3) can alter the stereochemical course of amidopalladation in the (IMes)Pd(TFA)2(H2O)-catalyzed aerobic oxidative amidation of alkene. In this study, the mechanism of (IMes)Pd(TFA)2(H2O)-catalyzed oxidative heterocyclization of (Z)-4-hexenyltosylamide was investigated in the presence and absence of exogenous base Na2CO3. The results reveal two parallel pathways in the absence of base: a cis-amidopalladation pathway with turnover-limiting deprotonation of the sulfonamide nucleophile and a trans-amidopalladation pathway with turnover-limiting nucleophilic attack of sulfonamide on the coordinated alkene. The addition of base (Na2CO3) lowers the energy barrier associated with the proton transfer, leading to an overall faster turnover rate and exclusive cis-amidopalladation of alkene.

  13. The Phase-2 ATLAS ITk Pixel Upgrade

    CERN Document Server

    Benoit, Mathieu; The ATLAS collaboration

    2017-01-01

    The entire tracking system of the ATLAS experiment will be replaced during the LHC Phase II shutdown (foreseen to take place around 2025) by an all-silicon detector called the “ITk” (Inner Tracker). The innermost portion of the ITk will consist of a pixel detector with stave-like support structures in the most central region and ring-shaped supports in the endcap regions; there may also be novel inclined support structures in the barrel-endcap overlap regions. The new detector could have as much as 14 m2 of sensitive silicon. Support structures will be based on low mass, highly stable and highly thermally conductive carbon-based materials cooled by evaporative carbon dioxide. The ITk will be instrumented with new sensors and readout electronics to provide improved tracking performance compared to the current detector. All the module components must be performant enough and robust enough to cope with the expected high particle multiplicity and severe radiation background of the High-Luminosity LHC. Readout...

  14. Serial powering of pixel modules

    CERN Document Server

    Stockmanns, Tobias; Hügging, Fabian Georg; Peric, I; Runólfsson, O; Wermes, Norbert

    2003-01-01

    Modern pixel detectors for the next generation of high-energy collider experiments like LHC use readout electronics in deep sub- micron technology. Chips in this technology need a low supply voltage of 2-2.5 V alongside high current consumption to achieve the desired performance. The high supply current leads to significant voltage drops in the long and low mass supply cables so that voltage fluctuations at the chips are induced, when the supply current changes. This problem scales with the number of modules when connected in parallel to the power supplies. An alternative powering scheme connects several modules in series resulting in a higher supply voltage but a lower current consumption of the chain and therefore a much lower voltage drop in the cables. In addition the amount of cables needed to supply the detector is vastly reduced. The concept and features of serial powering are presented and studies of the implementation of this technology as an alternative for the ATLAS pixel detector are shown. In par...

  15. Assembly procedure of the module (half-stave) of the ALICE Silicon Pixel Detector

    CERN Document Server

    Caselle, M; Antinori, F; Burns, M; Campbell, M; Chochula, P; Dinapoli, R; Elia, D; Formenti, F; Fini, R A; Ghidini, B; Kluge, A; Lenti, V; Manzari, V; Meddi, F; Morel, M; Navach, F; Nilsson, P; Pepato, Adriano; Riedler, P; Santoro, R; Stefanini, G; Viesti, G; Wyllie, K

    2004-01-01

    The Silicon Pixel Detector (SPD) forms the two innermost layers of the ALICE Inner Tracking System (ITS). The detector includes 1200 readout ASICs, each containing 8192 pixel cells, bump-bonded to Si sensor elements. The thickness of the readout chip and the sensor element is 150mum and 200mum, respectively. Low-mass solutions are implemented for the bus and the mechanical support. In this contribution, we describe the basic module (half-stave) of the two SPD layers and we give an overview of its assembly procedure.

  16. Serial Pixel Analog-to-Digital Converter

    Energy Technology Data Exchange (ETDEWEB)

    Larson, E D

    2010-02-01

    This method reduces the data path from the counter to the pixel register of the analog-to-digital converter (ADC) from as many as 10 bits to a single bit. The reduction in data path width is accomplished by using a coded serial data stream similar to a pseudo random number (PRN) generator. The resulting encoded pixel data is then decoded into a standard hexadecimal format before storage. The high-speed serial pixel ADC concept is based on the single-slope integrating pixel ADC architecture. Previous work has described a massively parallel pixel readout of a similar architecture. The serial ADC connection is similar to the state-of-the art method with the exception that the pixel ADC register is a shift register and the data path is a single bit. A state-of-the-art individual-pixel ADC uses a single-slope charge integration converter architecture with integral registers and “one-hot” counters. This implies that parallel data bits are routed among the counter and the individual on-chip pixel ADC registers. The data path bit-width to the pixel is therefore equivalent to the pixel ADC bit resolution.

  17. Tests of the gated mode for Belle II pixel detector

    Energy Technology Data Exchange (ETDEWEB)

    Prinker, Eduard [Max-Planck-Institute for Physics, Munich (Germany); Collaboration: Belle II-Collaboration

    2015-07-01

    DEPFET pixel detectors offer intrinsic amplification and very high signal to noise ratio. They form an integral building block for the vertex detector system of the Belle II experiment, which will start data taking in the year 2017 at the SuperKEKB Collider in Japan. A special Test board (Hybrid4) is used, which contains a small version of the DEPFET sensor with a read-out (DCD) and a steering chip (Switcher) attached, both controlled by a field-programmable gate array (FPGA) as the central interface to the computer. In order to keep the luminosity of the collider constant over time, the particle bunch currents have to be topped off by injecting additional bunches at a rate of 50 Hz. The particles in the daughter bunches produce a high rate of background (noisy bunches) for a short period of time, saturating the occupancy of the sensor. Operating the DEPFET sensor in a Gated Mode allows preserving the signals from collisions of normal bunches while protecting the pixels from background signals of the passing noisy bunches. An overview of the Gated Mode and first results is presented.

  18. Analysis of pixel systematics and space point reconstruction with DEPFET PXD5 matrices using high energy beam test data

    Energy Technology Data Exchange (ETDEWEB)

    Reuen, Lars

    2011-02-15

    To answer the current questions in particle physics vertex-detectors, the innermost sub-detector system of a multipurpose particle detector, with brilliant spatial resolution and at the same time with as little sensor material as possible are mandatory. These requirements are the driving force behind the newest generation of silicon pixel sensors like the DEPFET pixel, which incorporates the first amplification stage in form of a transistor in the fully depleted sensor bulk, allowing for a high spatial resolution even with thinned down sensors. A DEPFET pixel prototype system, build for the future TeV-scale liner collider ILC, was characterized in a high energy beam test at CERN with a spatial resolution and statistics that allowed for the first time in-pixel homogeneity measurements of DEPFET pixels. Yet, in the quest for higher precision the sensor development must be accompanied by progress in position reconstruction algorithms. A study with three novel approaches in position reconstruction was undertaken. The results of the in-pixel beam test and the performance of the new methods with an emphasis on {delta}-electrons will be presented here. (orig.)

  19. Silicon pixel-detector R&D for CLIC

    Science.gov (United States)

    Nürnberg, A.

    2016-11-01

    The physics aims at the future CLIC high-energy linear e+e- collider set very high precision requirements on the performance of the vertex and tracking detectors. Moreover, these detectors have to be well adapted to the experimental conditions, such as the time structure of the collisions and the presence of beam-induced backgrounds. The principal challenges are: a point resolution of a few μm, ultra-low mass (~ 0.2%X0 per layer for the vertex region and ~ 1%X0 per layer for the outer tracker), very low power dissipation (compatible with air-flow cooling in the inner vertex region) and pulsed power operation, complemented with ~ 10 ns time stamping capabilities. A highly granular all-silicon vertex and tracking detector system is under development, following an integrated approach addressing simultaneously the physics requirements and engineering constraints. For the vertex-detector region, hybrid pixel detectors with small pitch (25 μm) and analog readout are explored. For the outer tracking region, both hybrid concepts and fully integrated CMOS sensors are under consideration. The feasibility of ultra-thin sensor layers is validated with Timepix3 readout ASICs bump bonded to active edge planar sensors with 50 μm to 150 μm thickness. Prototypes of CLICpix readout ASICs implemented in 6525 nm CMOS technology with 25 μm pixel pitch have been produced. Hybridisation concepts have been developed for interconnecting these chips either through capacitive coupling to active HV-CMOS sensors or through bump-bonding to planar sensors. Recent R&D achievements include results from beam tests with all types of hybrid assemblies. Simulations based on Geant4 and TCAD are used to validate the experimental results and to assess and optimise the performance of various detector designs.

  20. Large area CMOS image sensors

    Science.gov (United States)

    Turchetta, R.; Guerrini, N.; Sedgwick, I.

    2011-01-01

    CMOS image sensors, also known as CMOS Active Pixel Sensors (APS) or Monolithic Active Pixel Sensors (MAPS), are today the dominant imaging devices. They are omnipresent in our daily life, as image sensors in cellular phones, web cams, digital cameras, ... In these applications, the pixels can be very small, in the micron range, and the sensors themselves tend to be limited in size. However, many scientific applications, like particle or X-ray detection, require large format, often with large pixels, as well as other specific performance, like low noise, radiation hardness or very fast readout. The sensors are also required to be sensitive to a broad spectrum of radiation: photons from the silicon cut-off in the IR down to UV and X- and gamma-rays through the visible spectrum as well as charged particles. This requirement calls for modifications to the substrate to be introduced to provide optimized sensitivity. This paper will review existing CMOS image sensors, whose size can be as large as a single CMOS wafer, and analyse the technical requirements and specific challenges of large format CMOS image sensors.