WorldWideScience

Sample records for photoemission electron microscope

  1. Electric field stimulation setup for photoemission electron microscopes.

    Science.gov (United States)

    Buzzi, M; Vaz, C A F; Raabe, J; Nolting, F

    2015-08-01

    Manipulating magnetisation by the application of an electric field in magnetoelectric multiferroics represents a timely issue due to the potential applications in low power electronics and the novel physics involved. Thanks to its element sensitivity and high spatial resolution, X-ray photoemission electron microscopy is a uniquely suited technique for the investigation of magnetoelectric coupling in multiferroic materials. In this work, we present a setup that allows for the application of in situ electric and magnetic fields while the sample is analysed in the microscope. As an example of the performances of the setup, we present measurements on Ni/Pb(Mg(0.66)Nb(0.33))O3-PbTiO3 and La(0.7)Sr(0.3)MnO3/PMN-PT artificial multiferroic nanostructures.

  2. Exploring the magnetic and organic microstructures with photoemission electron microscope

    International Nuclear Information System (INIS)

    Wei, D.H.; Chan, Yuet-Loy; Hsu, Yao-Jane

    2012-01-01

    Highlights: ► PEEM with polarized photon enables additional image contrasts and physical insights. ► XMCD-based images reveal the shape-dependent domains in Ni80Fe20 microstructures. ► XLD-based images confirm the success of molecular orientation controls. ► The two interfaces in Co–Pn–Co structures are magnetically and chemically different. -- Abstract: We present photoemission electron microscopy (PEEM) studies on geometrically constrained ferromagnetic, organic, and organics–ferromagnet hybrid structures. Powered by an elliptically polarized undulator, the PEEM at Taiwan Light Source (TLS) is capable of recording polarization enhanced X-ray images and has been employed to examine the domain configurations in a lithographically patterned permalloy film as well as the orientations of pentacene molecules adsorbed on self-assembled monolayers (SAMs) modified gold surfaces. In addition, magnetic images acquired on cobalt/pentacene and pentacene/cobalt bilayers reveal that in hybrid structures the order of thin film deposition can lead to distinct domain configurations. Spectroscopic evidence further suggests that there is significant orbital hybridization at the interface where metallic cobalt was deposited directly on organic pentacene.

  3. Exploring the magnetic and organic microstructures with photoemission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wei, D.H., E-mail: dhw@nsrrc.org.tw [National Synchrotron Radiation Research Center, Hsinchu Science Park, 30076 Hsinchu, Taiwan (China); Chan, Yuet-Loy; Hsu, Yao-Jane [National Synchrotron Radiation Research Center, Hsinchu Science Park, 30076 Hsinchu, Taiwan (China)

    2012-10-15

    Highlights: Black-Right-Pointing-Pointer PEEM with polarized photon enables additional image contrasts and physical insights. Black-Right-Pointing-Pointer XMCD-based images reveal the shape-dependent domains in Ni80Fe20 microstructures. Black-Right-Pointing-Pointer XLD-based images confirm the success of molecular orientation controls. Black-Right-Pointing-Pointer The two interfaces in Co-Pn-Co structures are magnetically and chemically different. -- Abstract: We present photoemission electron microscopy (PEEM) studies on geometrically constrained ferromagnetic, organic, and organics-ferromagnet hybrid structures. Powered by an elliptically polarized undulator, the PEEM at Taiwan Light Source (TLS) is capable of recording polarization enhanced X-ray images and has been employed to examine the domain configurations in a lithographically patterned permalloy film as well as the orientations of pentacene molecules adsorbed on self-assembled monolayers (SAMs) modified gold surfaces. In addition, magnetic images acquired on cobalt/pentacene and pentacene/cobalt bilayers reveal that in hybrid structures the order of thin film deposition can lead to distinct domain configurations. Spectroscopic evidence further suggests that there is significant orbital hybridization at the interface where metallic cobalt was deposited directly on organic pentacene.

  4. Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope.

    Science.gov (United States)

    Scholl, A; Marcus, M A; Doran, A; Nasiatka, J R; Young, A T; MacDowell, A A; Streubel, R; Kent, N; Feng, J; Wan, W; Padmore, H A

    2018-05-01

    Aberration correction by an electron mirror dramatically improves the spatial resolution and transmission of photoemission electron microscopes. We will review the performance of the recently installed aberration corrector of the X-ray Photoemission Electron Microscope PEEM-3 and show a large improvement in the efficiency of the electron optics. Hartmann testing is introduced as a quantitative method to measure the geometrical aberrations of a cathode lens electron microscope. We find that aberration correction leads to an order of magnitude reduction of the spherical aberrations, suggesting that a spatial resolution of below 100 nm is possible at 100% transmission of the optics when using x-rays. We demonstrate this improved performance by imaging test patterns employing element and magnetic contrast. Published by Elsevier B.V.

  5. An ultrafast electron microscope gun driven by two-photon photoemission from a nanotip cathode

    International Nuclear Information System (INIS)

    Bormann, Reiner; Strauch, Stefanie; Schäfer, Sascha; Ropers, Claus

    2015-01-01

    We experimentally and numerically investigate the performance of an advanced ultrafast electron source, based on two-photon photoemission from a tungsten needle cathode incorporated in an electron microscope gun geometry. Emission properties are characterized as a function of the electrostatic gun settings, and operating conditions leading to laser-triggered electron beams of very low emittance (below 20 nm mrad) are identified. The results highlight the excellent suitability of optically driven nano-cathodes for the further development of ultrafast transmission electron microscopy

  6. Introduction of spectroscopic photoemission and low energy electron microscope in SPring-8

    International Nuclear Information System (INIS)

    Guo, FangZhun; Kobayashi, Keisuke; Kinoshita, Toyohiko

    2005-01-01

    An upright configuration SPELEEM (Spectroscopic PhotoEmission and Low Energy Electron Microscope) has been introduced in SPring-8 in the framework of the nanotechnology support project of Ministry of Education, Culture, Sport, Science and Technology (MEXT), Japan. SPELEEM combines microscopy, spectroscopy and diffraction in one system, which allows a comprehensive characterization of the specimen. The combination of SPELEEM and polarized (circularly or linearly) soft X-rays in SPring-8 is expected to realize the highest performance. The characteristics of SPELEEM and typical results, for example nano-XANES (X-ray absorption near edge structure) of Fe oxide on Fe(100) surface, nano-XPS (X-ray photoemission spectroscopy) of indium (In) on Si(111) and antiferro-magnetic domain structure images of NiO(001) single crystal, are reported. (author)

  7. An aberration corrected photoemission electron microscope at the advanced light source

    International Nuclear Information System (INIS)

    Feng, J.; MacDowell, A.A.; Duarte, R.; Doran, A.; Forest, E.; Kelez, N.; Marcus, M.; Munson, D.; Padmore, H.; Petermann, K.; Raoux, S.; Robin, D.; Scholl, A.; Schlueter, R.; Schmid, P.; Stohr, J.; Wan, W.; Wei, D.H.; Wu, Y.

    2003-01-01

    Design of a new aberration corrected Photoemission electron microscope PEEM3 at the Advanced Light Source is outlined. PEEM3 will be installed on an elliptically polarized undulator beamline and will be used for the study of complex materials at high spatial and spectral resolution. The critical components of PEEM3 are the electron mirror aberration corrector and aberration-free magnetic beam separator. The models to calculate the optical properties of the electron mirror are discussed. The goal of the PEEM3 project is to achieve the highest possible transmission of the system at resolutions comparable to our present PEEM2 system (50 nm) and to enable significantly higher resolution, albeit at the sacrifice of intensity. We have left open the possibility to add an energy filter at a later date, if it becomes necessary driven by scientific need to improve the resolution further

  8. Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope

    International Nuclear Information System (INIS)

    Nickel, F.; Gottlob, D.M.; Krug, I.P.; Doganay, H.; Cramm, S.; Kaiser, A.M.; Lin, G.; Makarov, D.; Schmidt, O.G.

    2013-01-01

    We report on the implementation and usage of a synchrotron-based time-resolving operation mode in an aberration-corrected, energy-filtered photoemission electron microscope. The setup consists of a new type of sample holder, which enables fast magnetization reversal of the sample by sub-ns pulses of up to 10 mT. Within the sample holder current pulses are generated by a fast avalanche photo diode and transformed into magnetic fields by means of a microstrip line. For more efficient use of the synchrotron time structure, we developed an electrostatic deflection gating mechanism capable of beam blanking within a few nanoseconds. This allows us to operate the setup in the hybrid bunch mode of the storage ring facility, selecting one or several bright singular light pulses which are temporally well-separated from the normal high-intensity multibunch pulse pattern. - Highlights: • A new time-resolving operation mode in photoemission electron microscopy is shown. • Our setup works within an energy-filtered, aberration-corrected PEEM. • A new gating system for bunch selection using synchrotron radiation is developed. • An alternative magnetic excitation system is developed. • First tr-imaging using an energy-filtered, aberration-corrected PEEM is shown

  9. Angle-resolved photoemission spectroscopy with quantum gas microscopes

    Science.gov (United States)

    Bohrdt, A.; Greif, D.; Demler, E.; Knap, M.; Grusdt, F.

    2018-03-01

    Quantum gas microscopes are a promising tool to study interacting quantum many-body systems and bridge the gap between theoretical models and real materials. So far, they were limited to measurements of instantaneous correlation functions of the form 〈O ̂(t ) 〉 , even though extensions to frequency-resolved response functions 〈O ̂(t ) O ̂(0 ) 〉 would provide important information about the elementary excitations in a many-body system. For example, single-particle spectral functions, which are usually measured using photoemission experiments in electron systems, contain direct information about fractionalization and the quasiparticle excitation spectrum. Here, we propose a measurement scheme to experimentally access the momentum and energy-resolved spectral function in a quantum gas microscope with currently available techniques. As an example for possible applications, we numerically calculate the spectrum of a single hole excitation in one-dimensional t -J models with isotropic and anisotropic antiferromagnetic couplings. A sharp asymmetry in the distribution of spectral weight appears when a hole is created in an isotropic Heisenberg spin chain. This effect slowly vanishes for anisotropic spin interactions and disappears completely in the case of pure Ising interactions. The asymmetry strongly depends on the total magnetization of the spin chain, which can be tuned in experiments with quantum gas microscopes. An intuitive picture for the observed behavior is provided by a slave-fermion mean-field theory. The key properties of the spectra are visible at currently accessible temperatures.

  10. Photoemission for f-electron materials

    International Nuclear Information System (INIS)

    Huang, Youngsea.

    1989-01-01

    The dissertation investigates the interpretation of photoemission from f-electron materials. The authors also discuss unusual room temperature solid-state reactions in Yb-Cu films that they discovered. They show the importance of considering the entire system in the photoemission process and that photoemission actually measures the energy difference between total energies of the initial state and the final excited state of the whole system. They point out misconceptions in the current interpretation of photoemission from mixed valent materials. Their results on Yb-Cu system and other high-resolution photoemission measurements on mixed valent Yb-based materials show that the 4f feature is not pinned at the Fermi level though there is a 4f 14 (6s5d) 2 and 4f 13 (6s5d) 3 configuration degeneracy in the ground state. They suggest that this non-pinning is a general phenomenon due to the fact that the final state is not completely relaxed in the photoemission process. They discuss the current competing models of photoemission from Ce-based materials and show problems with their interpretations. As 4f electrons are more itinerant for Ce and Yb, they give a delocalized-localized kind of interpretation for 4f levels of Ce based materials. They employ the Ce-Yb analogy (electron-hole inversion and thereby an energy scale inversion) with the impurity model to photoemission from Yb-based materials and point out contradictory results on YbAl 3 in the literature. In their results on the Yb-Cu system, where the Yb valence varies from ∼3 to ∼2.2, they do not observe the Kondo resonance within the limits of their experimental resolution. They suggest that to date no Kondo resonance has been observed, and speculate either that the impurity model is inadequate for Yb-based materials or that photoemission is unable to detect a Kondo resonance

  11. Hot Electron Photoemission from Plasmonic Nanostructures: The Role of Surface Photoemission and Transition Absorption

    DEFF Research Database (Denmark)

    Babicheva, Viktoriia; Zhukovsky, Sergei; Ikhsanov, Renat Sh

    2015-01-01

    We study mechanisms of photoemission of hot electrons from plasmonic nanoparticles. We analyze the contribution of "transition absorption", i.e., loss of energy of electrons passing through the boundary between different materials, to the surface mechanism of photoemission. We calculate photoemis......We study mechanisms of photoemission of hot electrons from plasmonic nanoparticles. We analyze the contribution of "transition absorption", i.e., loss of energy of electrons passing through the boundary between different materials, to the surface mechanism of photoemission. We calculate...... photoemission rate and transition absorption for nanoparticles surrounded by various media with a broad range of permittivities and show that photoemission rate and transition absorption follow the same dependence on the permittivity. Thus, we conclude that transition absorption is responsible...

  12. Bulk sensitive hard x-ray photoemission electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Patt, M., E-mail: m.patt@fz-juelich.de; Wiemann, C. [Peter Grünberg Institute (PGI-6) and JARA-FIT, Research Center Jülich, D-52425 Jülich (Germany); Weber, N.; Escher, M.; Merkel, M. [Focus GmbH, Neukirchner Str. 2, D-65510 Hünstetten (Germany); Gloskovskii, A.; Drube, W. [DESY Photon Science, Deutsches Elektronen-Synchrotron, D-22603 Hamburg (Germany); Schneider, C. M. [Peter Grünberg Institute (PGI-6) and JARA-FIT, Research Center Jülich, D-52425 Jülich (Germany); Fakultät f. Physik and Center for Nanointegration Duisburg-Essen (CeNIDE), Universität Duisburg-Essen, D-47048 Duisburg (Germany)

    2014-11-15

    Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO{sub 3} sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.

  13. Timing analysis of two-electron photoemission

    International Nuclear Information System (INIS)

    Kheifets, A S; Ivanov, I A; Bray, Igor

    2011-01-01

    We predict a significant delay of two-electron photoemission from the helium atom after absorption of an attosecond XUV pulse. We establish this delay by solving the time-dependent Schroedinger equation and by subsequently tracing the field-free evolution of the two-electron wave packet. This delay can also be related to the energy derivative of the phase of the complex double-photoionization (DPI) amplitude which we evaluate by using the convergent close-coupling method. Our observations indicate that future attosecond time delay measurements on DPI of He can provide information on the absolute quantum phase and elucidate various mechanisms of this strongly correlated ionization process. (fast track communication)

  14. On the wide-energy-range tuning of x-ray photoemission electron microscope optics for the observation of the photoelectrons excited by several keV x-rays

    International Nuclear Information System (INIS)

    Yasufuku, H.; Yoshikawa, H.; Kimura, M.; Vlaicu, A.M.; Kato, M.; Kudo, M.; Fujikata, J.; Fukushima, S.

    2006-01-01

    We have newly developed an x-ray photoemission electron microscope (XPEEM) which uses both soft x-rays and hard x-rays at the undulator beam line BL15XU in the synchrotron radiation (SR) facility SPring-8 to observe various practical materials. In combination with an energy analyzer and high brilliant x-ray source, the detection of high kinetic energy inner-shell photoelectrons is essential for revealing the chemical properties of specimen subsurfaces or buried interfaces, owing to long inelastic mean free path of the high kinetic energy photoelectrons. The most significant result in our design is the new combined electric and magnetic field objective lens in which the magnetic field penetrates up to the sample surface. This allows the measurement with high spatial resolution of both low intensity images of inner-shell photoelectrons with high kinetic energy and high intensity images of secondary electrons. By using the sample bias scan method, we can easily change the focus condition of the objective lens in order to allow the energy filtered imaging with photoelectrons having the kinetic energy in a wide range (1-10 000 eV). By the combination of high brilliant SR x-rays, the new objective lens, and sample bias method, our XPEEM can successfully obtain the microarea x-ray photoelectron spectra and energy filtered XPEEM images of inner-shell photoelectrons, such as Si 1s, without any surface cleaning procedure. The energy filtered XPEEM image using photoelectrons from deep inner shells, Si 1s, was obtained for the first time

  15. Analytical Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — The Titan 80-300 is a transmission electron microscope (TEM) equipped with spectroscopic detectors to allow chemical, elemental, and other analytical measurements to...

  16. DC photoemission electron guns as ERL sources

    International Nuclear Information System (INIS)

    Sinclair, Charles K.

    2006-01-01

    Very-high-voltage DC electron guns, delivering moderate duration bunches from photoemission cathodes, and followed by conventional drift bunching and acceleration, offer a practical solution for an ERL injector. In a variant of this scheme, a DC gun is placed in close proximity to a superconducting RF accelerator cavity, with few or no active elements between the gun and cavity. The principal technical challenge with such electron guns arises from field emission from the cathode electrode and its support structure. Field emission may result in voltage breakdown across the cathode-anode gap, or a punch-through failure of the insulator holding off the cathode potential, as well as lesser though still serious problems. Various means to mitigate these problems are described. The operational lifetime of high quantum efficiency photocathodes in these guns is determined by the vacuum conditions, through phenomena such as chemical poisoning and ion back-bombardment. Minimization of the field strength on electrode structures pushes high-voltage DC guns toward large dimensions and, correspondingly, large outgassing loads, but it is also true that these guns offer many opportunities for achieving excellent vacuum conditions. Good solutions to vacuum problems that had previously limited cathode lifetime have been demonstrated in recent years. Designs for DC guns presently in use and planned for the near future will be described. The parameters necessary for a 100 mA average current, very-high-voltage DC gun with a photocathode operational lifetime greater than 100 h appear to be within reach, but have yet to be demonstrated. A 1 A average current source with good cathode operational lifetime will require developments beyond the present state-of-the-art

  17. Scanning Auger Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

  18. Photoemission electronic states of epitaxially grown magnetite films

    International Nuclear Information System (INIS)

    Zalecki, R.; Kolodziejczyk, A.; Korecki, J.; Spiridis, N.; Zajac, M.; Kozlowski, A.; Kakol, Z.; Antolak, D.

    2007-01-01

    The valence band photoemission spectra of epitaxially grown 300 A single crystalline magnetite films were measured by the angle-resolved ultraviolet photoemission spectroscopy (ARUPS) at 300 K. The samples were grown either on MgO(0 0 1) (B termination) or on (0 0 1) Fe (iron-rich A termination), thus intentionally presenting different surface stoichiometry, i.e. also different surface electronic states. Four main features of the electron photoemission at about -1.0, -3.0, -5.5 and -10.0 eV below a chemical potential show systematic differences for two terminations; this difference depends on the electron outgoing angle. Our studies confirm sensitivity of angle resolved PES technique on subtleties of surface states

  19. Three-dimensional characterization of extreme ultraviolet mask blank defects by interference contrast photoemission electron microscopy.

    Science.gov (United States)

    Lin, Jingquan; Weber, Nils; Escher, Matthias; Maul, Jochen; Han, Hak-Seung; Merkel, Michael; Wurm, Stefan; Schönhense, Gerd; Kleineberg, Ulf

    2008-09-29

    A photoemission electron microscope based on a new contrast mechanism "interference contrast" is applied to characterize extreme ultraviolet lithography mask blank defects. Inspection results show that positioning of interference destructive condition (node of standing wave field) on surface of multilayer in the local region of a phase defect is necessary to obtain best visibility of the defect on mask blank. A comparative experiment reveals superiority of the interference contrast photoemission electron microscope (Extreme UV illumination) over a topographic contrast one (UV illumination with Hg discharge lamp) in detecting extreme ultraviolet mask blank phase defects. A depth-resolved detection of a mask blank defect, either by measuring anti-node peak shift in the EUV-PEEM image under varying inspection wavelength condition or by counting interference fringes with a fixed illumination wavelength, is discussed.

  20. Scanning electron microscope

    International Nuclear Information System (INIS)

    Anon.

    1980-01-01

    The principle underlying the design of the scanning electron microscope (SEM), the design and functioning of SEM are described. Its applications in the areas of microcircuitry and materials science are outlined. The development of SEM in India is reviewed. (M.G.B.)

  1. Electron microscope studies

    International Nuclear Information System (INIS)

    Crewe, A.V.; Kapp, O.H.

    1992-01-01

    This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations

  2. Electron microscope studies

    Energy Technology Data Exchange (ETDEWEB)

    Crewe, A.V.; Kapp, O.H.

    1992-07-01

    This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

  3. Electronic Structure of the Kitaev Material α-RuCl3 Probed by Photoemission and Inverse Photoemission Spectroscopies

    OpenAIRE

    Soobin Sinn; Choong Hyun Kim; Beom Hyun Kim; Kyung Dong Lee; Choong Jae Won; Ji Seop Oh; Moonsup Han; Young Jun Chang; Namjung Hur; Hitoshi Sato; Byeong-Gyu Park; Changyoung Kim; Hyeong-Do Kim; Tae Won Noh

    2016-01-01

    Recently, $\\alpha$-$\\textrm{RuCl}_3$ has attracted much attention as a possible material realization of the honeycomb Kitaev model, which may stabilize a quantum-spin-liquid state. Compared to extensive studies on its magnetic properties, there is still a lack of understanding on its electronic structure, which is strongly related with its Kitaev physics. Here, the electronic structure of $\\alpha$-$\\textrm{RuCl}_3$ is investigated by photoemission (PE) and inverse photoemission (IPE) spectros...

  4. Electron microscope phase enhancement

    Science.gov (United States)

    Jin, Jian; Glaeser, Robert M.

    2010-06-15

    A microfabricated electron phase shift element is used for modifying the phase characteristics of an electron beam passing though its center aperture, while not affecting the more divergent portion of an incident beam to selectively provide a ninety-degree phase shift to the unscattered beam in the back focal plan of the objective lens, in order to realize Zernike-type, in-focus phase contrast in an electron microscope. One application of the element is to increase the contrast of an electron microscope for viewing weakly scattering samples while in focus. Typical weakly scattering samples include biological samples such as macromolecules, or perhaps cells. Preliminary experimental images demonstrate that these devices do apply a ninety degree phase shift as expected. Electrostatic calculations have been used to determine that fringing fields in the region of the scattered electron beams will cause a negligible phase shift as long as the ratio of electrode length to the transverse feature-size aperture is about 5:1. Calculations are underway to determine the feasibility of aspect smaller aspect ratios of about 3:1 and about 2:1.

  5. Forensic Scanning Electron Microscope

    Science.gov (United States)

    Keeley, R. H.

    1983-03-01

    The scanning electron microscope equipped with an x-ray spectrometer is a versatile instrument which has many uses in the investigation of crime and preparation of scientific evidence for the courts. Major applications include microscopy and analysis of very small fragments of paint, glass and other materials which may link an individual with a scene of crime, identification of firearms residues and examination of questioned documents. Although simultaneous observation and chemical analysis of the sample is the most important feature of the instrument, other modes of operation such as cathodoluminescence spectrometry, backscattered electron imaging and direct x-ray excitation are also exploited. Marks on two bullets or cartridge cases can be compared directly by sequential scanning with a single beam or electronic linkage of two instruments. Particles of primer residue deposited on the skin and clothing when a gun is fired can be collected on adhesive tape and identified by their morphology and elemental composition. It is also possible to differentiate between the primer residues of different types of ammunition. Bullets may be identified from the small fragments left behind as they pass through the body tissues. In the examination of questioned documents the scanning electron microscope is used to establish the order in which two intersecting ink lines were written and to detect traces of chemical markers added to the security inks on official documents.

  6. Transmission electron microscope CCD camera

    Science.gov (United States)

    Downing, Kenneth H.

    1999-01-01

    In order to improve the performance of a CCD camera on a high voltage electron microscope, an electron decelerator is inserted between the microscope column and the CCD. This arrangement optimizes the interaction of the electron beam with the scintillator of the CCD camera while retaining optimization of the microscope optics and of the interaction of the beam with the specimen. Changing the electron beam energy between the specimen and camera allows both to be optimized.

  7. Photocathode Optimization for a Dynamic Transmission Electron Microscope: Final Report

    Energy Technology Data Exchange (ETDEWEB)

    Ellis, P; Flom, Z; Heinselman, K; Nguyen, T; Tung, S; Haskell, R; Reed, B W; LaGrange, T

    2011-08-04

    The Dynamic Transmission Electron Microscope (DTEM) team at Harvey Mudd College has been sponsored by LLNL to design and build a test setup for optimizing the performance of the DTEM's electron source. Unlike a traditional TEM, the DTEM achieves much faster exposure times by using photoemission from a photocathode to produce electrons for imaging. The DTEM team's work is motivated by the need to improve the coherence and current density of the electron cloud produced by the electron gun in order to increase the image resolution and contrast achievable by DTEM. The photoemission test setup is nearly complete and the team will soon complete baseline tests of electron gun performance. The photoemission laser and high voltage power supply have been repaired; the optics path for relaying the laser to the photocathode has been finalized, assembled, and aligned; the internal setup of the vacuum chamber has been finalized and mostly implemented; and system control, synchronization, and data acquisition has been implemented in LabVIEW. Immediate future work includes determining a consistent alignment procedure to place the laser waist on the photocathode, and taking baseline performance measurements of the tantalum photocathode. Future research will examine the performance of the electron gun as a function of the photoemission laser profile, the photocathode material, and the geometry and voltages of the accelerating and focusing components in the electron gun. This report presents the team's progress and outlines the work that remains.

  8. Layer- and lateral-resolved magnetization studies using photoemission electron microscopy

    International Nuclear Information System (INIS)

    Wei, D.H.; Hsu, Y.J.; Lin, C.-C.; Lai, C.-H.; Ou, J.Y.; Wu, J.C.

    2004-01-01

    The magnetic circular dichroism in X-ray absorption is employed to study the element-specific magnetization in a TbFe/Co bilayer system and patterned Ni 80 Fe 20 film. Taking advantage of the energy tunability as well as the penetration power of synchrotron radiation, the magnetization directions of Co and Fe deposited in different layers were examined as a function of Co film thickness. For patterned films, the photoemission electron microscope reveals a clear correlation between the magnetic configurations and geometries of the patterns

  9. Photoemission electron microscopy of localized surface plasmons in silver nanostructures at telecommunication wavelengths

    Energy Technology Data Exchange (ETDEWEB)

    Mårsell, Erik; Larsen, Esben W.; Arnold, Cord L.; Xu, Hongxing; Mauritsson, Johan; Mikkelsen, Anders, E-mail: anders.mikkelsen@sljus.lu.se [Department of Physics, Lund University, P.O. Box 118, 22 100 Lund (Sweden)

    2015-02-28

    We image the field enhancement at Ag nanostructures using femtosecond laser pulses with a center wavelength of 1.55 μm. Imaging is based on non-linear photoemission observed in a photoemission electron microscope (PEEM). The images are directly compared to ultra violet PEEM and scanning electron microscopy (SEM) imaging of the same structures. Further, we have carried out atomic scale scanning tunneling microscopy on the same type of Ag nanostructures and on the Au substrate. Measuring the photoelectron spectrum from individual Ag particles shows a larger contribution from higher order photoemission processes above the work function threshold than would be predicted by a fully perturbative model, consistent with recent results using shorter wavelengths. Investigating a wide selection of both Ag nanoparticles and nanowires, field enhancement is observed from 30% of the Ag nanoparticles and from none of the nanowires. No laser-induced damage is observed of the nanostructures neither during the PEEM experiments nor in subsequent SEM analysis. By direct comparison of SEM and PEEM images of the same nanostructures, we can conclude that the field enhancement is independent of the average nanostructure size and shape. Instead, we propose that the variations in observed field enhancement could originate from the wedge interface between the substrate and particles electrically connected to the substrate.

  10. Fermi liquid character in the photoemission/inverse photoemission spectra of highly correlated electron systems

    International Nuclear Information System (INIS)

    Riseborough, P.S.

    1990-01-01

    We calculate the photoemission/inverse photoemission spectrum for an N-fold degenerate Hubbard model, in the 1/N approximation. The spectra are broadened, and for sufficiently large Coulomb interaction strengths the spectra show satellites both in the photoemission and the brehmstrahlung isochromat spectroscopy portions of the spectra. The intensity of the spectra at the fermi level are equal to the noninteracting values, in accordance with Luttinger's theorem. We show that this can result in a temperature-dependent peak at the Fermi level; the width of the peak is governed by the quasi-particle lifetime. We relate the temperature dependent peak to the Fermi-liquid properties

  11. Microlens Array Laser Transverse Shaping Technique for Photoemission Electron Source

    Energy Technology Data Exchange (ETDEWEB)

    Halavanau, A. [Northern Illinois Univ., DeKalb, IL (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Ha, G. [Argonne National Lab. (ANL), Argonne, IL (United States); Pohang Univ. of Science and Technology (POSTECH) (Korea, Republic of); Qiang, G. [Argonne National Lab. (ANL), Argonne, IL (United States); Tsinghua Univ., Beijing (China); Gai, W. [Argonne National Lab. (ANL), Argonne, IL (United States); Power, J. [Argonne National Lab. (ANL), Argonne, IL (United States); Piot, P. [Northern Illinois Univ., DeKalb, IL (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Wisniewski, E. [Argonne National Lab. (ANL), Argonne, IL (United States); Edstrom, D. [Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Ruan, J. [Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Santucci, J. [Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)

    2016-09-06

    A common issue encountered in photoemission electron sources used in electron accelerators is distortion of the laser spot due to non ideal conditions at all stages of the amplification. Such a laser spot at the cathode may produce asymmetric charged beams that will result in degradation of the beam quality due to space charge at early stages of acceleration and fail to optimally utilize the cathode surface. In this note we study the possibility of using microlens arrays to dramatically improve the transverse uniformity of the drive laser pulse on UV photocathodes at both Fermilab Accelerator Science \\& Technology (FAST) facility and Argonne Wakefield Accelerator (AWA). In particular, we discuss the experimental characterization of the homogeneity and periodic patterned formation at the photocathode. Finally, we compare the experimental results with the paraxial analysis, ray tracing and wavefront propagation software.

  12. A fluorescence scanning electron microscope

    International Nuclear Information System (INIS)

    Kanemaru, Takaaki; Hirata, Kazuho; Takasu, Shin-ichi; Isobe, Shin-ichiro; Mizuki, Keiji; Mataka, Shuntaro; Nakamura, Kei-ichiro

    2009-01-01

    Fluorescence techniques are widely used in biological research to examine molecular localization, while electron microscopy can provide unique ultrastructural information. To date, correlative images from both fluorescence and electron microscopy have been obtained separately using two different instruments, i.e. a fluorescence microscope (FM) and an electron microscope (EM). In the current study, a scanning electron microscope (SEM) (JEOL JXA8600 M) was combined with a fluorescence digital camera microscope unit and this hybrid instrument was named a fluorescence SEM (FL-SEM). In the labeling of FL-SEM samples, both Fluolid, which is an organic EL dye, and Alexa Fluor, were employed. We successfully demonstrated that the FL-SEM is a simple and practical tool for correlative fluorescence and electron microscopy.

  13. Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry (PE-EA-IMS)

    International Nuclear Information System (INIS)

    Su, Desheng; Niu, Wenqi; Liu, Sheng; Shen, Chengyin; Huang, Chaoqun; Wang, Hongmei; Jiang, Haihe; Chu, Yannan

    2012-01-01

    Photoemission electron attachment ion mobility spectrometry (PE-EA-IMS), with a source of photoelectrons induced by vacuum ultraviolet radiation on a metal surface, has been developed to study electron attachment reaction at atmospheric pressure using nitrogen as the buffer gas. Based on the negative ion mobility spectra, the rate constants for electron attachment to tetrachloromethane and chloroform were measured at ambient temperature as a function of the average electron energy in the range from 0.29 to 0.96 eV. The experimental results are in good agreement with the data reported in the literature. - Highlights: ► Photoemission electron attachment ion mobility spectrometry (PE-EA-IMS) was developed to study electron attachment reaction. ► The rate constants of electron attachment to CCl 4 and CHCl 3 were determined. ► The present experimental results are in good agreement with the previously reported data.

  14. Electron microscope studies

    International Nuclear Information System (INIS)

    Crewe, A.V.; Kapp, O.H.

    1990-01-01

    Our laboratory has made significant progress this year in devising improved electron-optical systems, in studying invertebrate hemoglobins with the STEM, and in achieving a workable sub-angstrom STEM. Our goal in electron optics is to improve resolution by producing spherical and chromatic aberration coefficients with signs opposite those of magnetic lenses. We have progressed toward this goal through calculations that explore the addition of electrodes to electron mirrors to reduce these two geometric aberrations and by devising a beam separation system that won't introduce asymmetrical aberrations. Some promising new designs of magnetic lenses for SEM applications have also been investigated. We have continued our exploration of the quaternary structure of the invertebrate hemoglobins and are now among the top laboratories in this area of expertise. In addition, we have overcome many of our electronic difficulties on the sub-angstrom STEM and have made significant progress toward achieving an operational system. The addition of an IBM RISC-6000 workstation to our lab has significantly increased our image processing capabilities

  15. Photoemission studies using femtosecond pulses for high brightness electron beams

    International Nuclear Information System (INIS)

    Srinivasan-Rao, T.; Tsang, T.; Fischer, J.

    1990-06-01

    We present the results of a series of experiments where various metal photocathodes are irradiated with ultrashort laser pulses, whose characteristics are: λ = 625 nm, τ = 100 fs, PRR = 89.5 MHz, Hν = 2 eV and average power 25 mW in each of the two beams. The quantum efficiency of the metals range from ∼10 -12 to 10 -8 at a power density of 100 MW/cm 2 at normal incidence. Since all the electrons are emitted due to multiphoton processes, these efficiencies are expected to increase substantially at large intensities. The efficiency at 100 MW/cm 2 has been increased by using p-polarized light at oblique incidence by ∼20x and by mediating the electron emission through surface plasmon excitation by ∼10 3 x. For the low intensities used in these experiments, the electron pulse duration is almost the same as the laser pulse duration for both the bulk and the surface plasmon mediated photoemission. 7 refs., 8 figs., 2 tabs

  16. Extreme regimes of femtosecond photoemission from a copper cathode in a dc electron gun

    Directory of Open Access Journals (Sweden)

    P. L. E. M. Pasmans

    2016-10-01

    Full Text Available The femtosecond photoemission yield from a copper cathode and the emittance of the created electron beams has been studied in a 12  MeV/m, 100 keV dc electron gun over a wide range of laser fluence, from the linear photoemission regime until the onset of image charge limitations and cathode damaging. The measured photoemission curves can be described well with available theory which includes the Schottky effect, second-order photoemission, and image charge limitation. The second-order photoemission can be explained by thermally assisted one-photon photoemission (1PPE and by above-threshold two-photon photoemission (2PPE. Measurements with a fresh cathode suggest that the 2PPE process is dominant. The beam emittance has been measured for the entire range of initial surface charge densities as well. The emittance measurements of space-charge dominated beams can be described well by an envelope equation with generalized perveance. The dc gun produces 0.1 pC bunches with 25 nm rms normalized emittance, corresponding to a normalized brightness usually associated with rf photoguns. In this experimental study the limits of femtosecond photoemission from a copper cathode have been explored and analyzed in great detail, resulting in improved understanding of the underlying mechanisms.

  17. Electron microscope studies

    International Nuclear Information System (INIS)

    Crewe, A.V.; Kapp, O.H.

    1991-01-01

    This year our laboratory has continued to make progress in the design of electron-optical systems, in the study of structure-function relationships of large multi-subunit proteins, in the development of new image processing software and in achieving a workable sub-angstrom STEM. We present an algebraic approach to the symmetrical Einzel (unipotential) lens wherein we simplify the analysis by specifying a field shape that meets some preferred set of boundary or other conditions and then calculate the fields. In a second study we generalize this approach to study of three element electrostatic lenses of which the symmetrical Einzel lens is a particular form. The purpose is to develop a method for assisting in the design of a lens for a particular purpose. In our biological work we study a stable and functional dodecameric complex of globin chains from the hemoglobin of Lumbricus terrestris. This is a complex lacking the ''linker'' subunit first imaged in this lab and required for maintenance of the native structure. In addition, we do a complete work-up on the hemoglobin of the marine polychaete Eudistylia vancouverii demonstrating the presence of a hierarchy of globin complexes. We demonstrate stable field-emission in the sub-angstrom STEM and the preliminary alignment of the beam. We continue our exploration of a algorithms for alignment of sequences of protein and DNA. Our computer facilities now include four second generation RISC workstations and we continue to take increasing advantage of the floating-point and graphical performance of these devices

  18. Development of high current electron source using photoemission from metals with ultrashort laser pulses

    International Nuclear Information System (INIS)

    Tsang, T.; Srinivasan-Rao, T.; Fischer, J.

    1990-10-01

    We summarize the studies of photoemission from metal photocathodes using picosecond pulses in the UV (4.66 eV) wavelength and femtosecond laser pulses in the visible (2 eV) wavelengths. To achieve high current density yield from metal photocathodes, multiphoton photoemission using femtosecond laser pulses are suggested. Electron yield improvement incorporating surface photoemission and surface plasmon resonance in metals and metal films are demonstrated. We examine the possibility of the nonlinear photoemission process overtaking the linear process, and identity some possible complexity. To extract the large amount of electrons free of space charge, a pulsed high voltage is designed; the results of the preliminary test are presented. Finally, for the first time, the width of the electron temporal profiles are measured, utilizing the nonlinear photoelectric effect, to below 100 fsec time regime. The results indicated that the electron pulse duration follows the laser pulses and are not limited by the material. 8 refs., 15 figs

  19. Many-body effects in X-ray photoemission spectroscopy and electronic properties of solids

    International Nuclear Information System (INIS)

    Kohiki, S.

    1999-01-01

    Photoemission from a solid is evidently a many-body process since the motion of each electron cannot be independent of the motions of other electrons. In this article we review the reported many-body effects in X-ray photoemission such as extra-atomic relaxation energy, charge transfer satellite and energy loss structure which are informative in relation to the characteristics of solids. (Copyright (c) 1999 Elsevier Science B.V., Amsterdam. All rights reserved.)

  20. Theory of photoemission and inverse-photoemission spectra of highly correlated electron systems: A weak-coupling 1/N expansion

    International Nuclear Information System (INIS)

    Riseborough, P.S.

    1989-01-01

    An N-fold-degenerate Hubbard model is examined in the weak-coupling regime. The one-electron Green's function is calculated from a systematic expansion of the irreducible self-energy in powers of 1/N. To lowest order in the expansion, one obtains a trivial mean-field theory. In the next leading order in 1/N, one finds that the dynamics are dominated by bosonlike collective excitations. The resulting expansion has the characteristics of the standard weak-coupling field theory, except the inclusion of the 1/N factors extends the regime of applicability to include Stoner-like enhancement factors which can be N times larger. The joint valence-band photoemission and inverse-photoemission spectrum is given by the trace of the imaginary part of the one-electron Green's function. The electronic spectrum has been calculated by truncating the series expansion for the self-energy in the lowest nontrivial order of 1/N. For small values of the Coulomb interaction between the electrons, the spectrum reduces to the form obtained by calculating the self-energy to second order in the Coulomb interaction. The spectra shows a narrowing of the band in the vicinity of the Fermi level and long high-energy band tails. When the boson spectrum softens, indicating the vicinity of a phase transition, the electronic spectrum shows the appearance of satellites. The results are compared with experimental observations of anomalies in the electronic spectra of uranium-based systems. The relation between the electronic spectrum and the thermodynamic mass enhancements is also discussed

  1. Spectral Interferometry with Electron Microscopes

    Science.gov (United States)

    Talebi, Nahid

    2016-01-01

    Interference patterns are not only a defining characteristic of waves, but also have several applications; characterization of coherent processes and holography. Spatial holography with electron waves, has paved the way towards space-resolved characterization of magnetic domains and electrostatic potentials with angstrom spatial resolution. Another impetus in electron microscopy has been introduced by ultrafast electron microscopy which uses pulses of sub-picosecond durations for probing a laser induced excitation of the sample. However, attosecond temporal resolution has not yet been reported, merely due to the statistical distribution of arrival times of electrons at the sample, with respect to the laser time reference. This is however, the very time resolution which will be needed for performing time-frequency analysis. These difficulties are addressed here by proposing a new methodology to improve the synchronization between electron and optical excitations through introducing an efficient electron-driven photon source. We use focused transition radiation of the electron as a pump for the sample. Due to the nature of transition radiation, the process is coherent. This technique allows us to perform spectral interferometry with electron microscopes, with applications in retrieving the phase of electron-induced polarizations and reconstructing dynamics of the induced vector potential. PMID:27649932

  2. Electronic Structure of the Kitaev Material α-RuCl3 Probed by Photoemission and Inverse Photoemission Spectroscopies

    Science.gov (United States)

    Sinn, Soobin; Kim, Choong Hyun; Kim, Beom Hyun; Lee, Kyung Dong; Won, Choong Jae; Oh, Ji Seop; Han, Moonsup; Chang, Young Jun; Hur, Namjung; Sato, Hitoshi; Park, Byeong-Gyu; Kim, Changyoung; Kim, Hyeong-Do; Noh, Tae Won

    2016-12-01

    Recently, α-RuCl3 has attracted much attention as a possible material to realize the honeycomb Kitaev model of a quantum-spin-liquid state. Although the magnetic properties of α-RuCl3 have been extensively studied, its electronic structure, which is strongly related to its Kitaev physics, is poorly understood. Here, the electronic structure of α-RuCl3 was investigated by photoemission (PE) and inverse-photoemission (IPE) spectroscopies. The band gap was directly measured from the PE and IPE spectra and was found to be 1.9 eV, much larger than previously estimated values. Local density approximation (LDA) calculations showed that the on-site Coulomb interaction U could open the band gap without spin-orbit coupling (SOC). However, the SOC should also be incorporated to reproduce the proper gap size, indicating that the interplay between U and SOC plays an essential role. Several features of the PE and IPE spectra could not be explained by the results of LDA calculations. To explain such discrepancies, we performed configuration-interaction calculations for a RuCl63- cluster. The experimental data and calculations demonstrated that the 4d compound α-RuCl3 is a Jeff = 1/2 Mott insulator rather than a quasimolecular-orbital insulator. Our study also provides important physical parameters required for verifying the proposed Kitaev physics in α-RuCl3.

  3. Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using synchrotron radiation

    Science.gov (United States)

    Wiemann, C.; Kaiser, A. M.; Cramm, S.; Schneider, C. M.

    2012-06-01

    In this paper, we present a newly developed gating technique for a time-resolving photoemission microscope. The technique makes use of an electrostatic deflector within the microscope's electron optical system for fast switching between two electron-optical paths, one of which is used for imaging, while the other is blocked by an aperture stop. The system can be operated with a switching time of 20 ns and shows superior dark current rejection. We report on the application of this new gating technique to exploit the time structure in the injection bunch pattern of the synchrotron radiation source BESSY II at Helmholtz-Zentrum Berlin for time-resolved measurements in the picosecond regime.

  4. Untangling the contributions of image charge and laser profile for optimal photoemission of high-brightness electron beams

    International Nuclear Information System (INIS)

    Portman, J.; Zhang, H.; Makino, K.; Ruan, C. Y.; Berz, M.; Duxbury, P. M.

    2014-01-01

    Using our model for the simulation of photoemission of high brightness electron beams, we investigate the virtual cathode physics and the limits to spatio-temporal and spectroscopic resolution originating from the image charge on the surface and from the profile of the exciting laser pulse. By contrasting the effect of varying surface properties (leading to expanding or pinned image charge), laser profiles (Gaussian, uniform, and elliptical), and aspect ratios (pancake- and cigar-like) under different extraction field strengths and numbers of generated electrons, we quantify the effect of these experimental parameters on macroscopic pulse properties such as emittance, brightness (4D and 6D), coherence length, and energy spread. Based on our results, we outline optimal conditions of pulse generation for ultrafast electron microscope systems that take into account constraints on the number of generated electrons and on the required time resolution.

  5. Efficient temporal shaping of electron distributions for high-brightness photoemission electron guns

    Directory of Open Access Journals (Sweden)

    Ivan V. Bazarov

    2008-04-01

    Full Text Available To achieve the lowest emittance electron bunches from photoemission electron guns, it is essential to limit the uncorrelated emittance growth due to space charge forces acting on the bunch in the vicinity of the photocathode through appropriate temporal shaping of the optical pulses illuminating the photocathode. We present measurements of the temporal profile of electron bunches from a bulk crystal GaAs photocathode illuminated with 520 nm wavelength pulses from a frequency-doubled Yb-fiber laser. A transverse deflecting rf cavity was used to make these measurements. The measured laser pulse temporal profile and the corresponding electron beam temporal profile have about 30 ps FWHM duration, with rise and fall times of a few ps. GaAs illuminated by 520 nm optical pulses is a prompt emitter within our measurement uncertainty of ∼1  ps rms. Combined with the low thermal emittance of negative electron affinity photocathodes, GaAs is a very suitable photocathode for high-brightness photoinjectors. We also report measurements of the photoemission response time for GaAsP, which show a strong dependence on the quantum efficiency of the photocathode.

  6. Photoemission electron microscopy for the study of ferromagnetic and antiferromagnetic materials

    International Nuclear Information System (INIS)

    Anders, Simone; Scholl, Andreas; Nolting, Frithjof; Padmore, Howard A.; Luening, Jan; Stoehr, Joachim; Scheinfein, Michael

    2000-01-01

    Photoemission electron microscopy (PEEM) is a full field imaging technique where x-ray exited electrons are used to form an image of the sample surface as a function of the x-ray photon energy and polarization. Contrast in PEEM can be due to a number of mechanisms including topographical, work function, elemental, chemical, polarization, x-ray magnetic circular and linear dichroism contrast. This wide range of contrast mechanisms together with the surface sensitivity and high spatial resolution make PEEM a very useful tool for the study of magnetic materials. PEEM-II is a new microscope installed at the bending magnet beamline 7.3.1.1 of the Advanced Light Source. In the present paper we describe the design and features of PEEM-II, and show results of our recent studies. Using PEEM and its elemental specificity, it is possible to investigate the various layers in magnetic multilayer structures independently. The experiments described here include the investigation of the switching behavior of magnetic multilayer structures that are of interest for magnetic RAM applications. The study of antiferromagnetic surfaces and thin films are of great importance for devices based on the effect of exchange bias. To date, studies at high-spatial-resolution of exchange bias systems has been difficult because of the lack of appropriate investigation methods. Here we demonstrate how PEEM has been used to image antiferromagnetic structure on surfaces with high spatial resolution

  7. Attosecond-controlled photoemission from metal nanowire tips in the few-electron regime

    KAUST Repository

    Ahn, B.

    2017-02-07

    Metal nanotip photoemitters have proven to be versatile in fundamental nanoplasmonics research and applications, including, e.g., the generation of ultrafast electron pulses, the adiabatic focusing of plasmons, and as light-triggered electron sources for microscopy. Here, we report the generation of high energy photoelectrons (up to 160 eV) in photoemission from single-crystalline nanowire tips in few-cycle, 750-nm laser fields at peak intensities of (2-7.3) × 1012 W/cm2. Recording the carrier-envelope phase (CEP)-dependent photoemission from the nanowire tips allows us to identify rescattering contributions and also permits us to determine the high-energy cutoff of the electron spectra as a function of laser intensity. So far these types of experiments from metal nanotips have been limited to an emission regime with less than one electron per pulse. We detect up to 13 e/shot and given the limited detection efficiency, we expect up to a few ten times more electrons being emitted from the nanowire. Within the investigated intensity range, we find linear scaling of cutoff energies. The nonlinear scaling of electron count rates is consistent with tunneling photoemission occurring in the absence of significant charge interaction. The high electron energy gain is attributed to field-induced rescattering in the enhanced nanolocalized fields at the wires apex, where a strong CEP-modulation is indicative of the attosecond control of photoemission.

  8. Angle-Resolved Photoemission Spectroscopy on Electronic Structure and Electron-Phonon Coupling in Cuprate Superconductors

    Energy Technology Data Exchange (ETDEWEB)

    Zhou, X.J.

    2010-04-30

    In addition to the record high superconducting transition temperature (T{sub c}), high temperature cuprate superconductors are characterized by their unusual superconducting properties below T{sub c}, and anomalous normal state properties above T{sub c}. In the superconducting state, although it has long been realized that superconductivity still involves Cooper pairs, as in the traditional BCS theory, the experimentally determined d-wave pairing is different from the usual s-wave pairing found in conventional superconductors. The identification of the pairing mechanism in cuprate superconductors remains an outstanding issue. The normal state properties, particularly in the underdoped region, have been found to be at odd with conventional metals which is usually described by Fermi liquid theory; instead, the normal state at optimal doping fits better with the marginal Fermi liquid phenomenology. Most notable is the observation of the pseudogap state in the underdoped region above T{sub c}. As in other strongly correlated electrons systems, these unusual properties stem from the interplay between electronic, magnetic, lattice and orbital degrees of freedom. Understanding the microscopic process involved in these materials and the interaction of electrons with other entities is essential to understand the mechanism of high temperature superconductivity. Since the discovery of high-T{sub c} superconductivity in cuprates, angle-resolved photoemission spectroscopy (ARPES) has provided key experimental insights in revealing the electronic structure of high temperature superconductors. These include, among others, the earliest identification of dispersion and a large Fermi surface, an anisotropic superconducting gap suggestive of a d-wave order parameter, and an observation of the pseudogap in underdoped samples. In the mean time, this technique itself has experienced a dramatic improvement in its energy and momentum resolutions, leading to a series of new discoveries not

  9. Angle-Resolved Photoemission Spectroscopy on Electronic Structure and Electron-Phonon Coupling in Cuprate Superconductors

    International Nuclear Information System (INIS)

    Zhou, X.J.

    2010-01-01

    In addition to the record high superconducting transition temperature (T c ), high temperature cuprate superconductors are characterized by their unusual superconducting properties below T c , and anomalous normal state properties above T c . In the superconducting state, although it has long been realized that superconductivity still involves Cooper pairs, as in the traditional BCS theory, the experimentally determined d-wave pairing is different from the usual s-wave pairing found in conventional superconductors. The identification of the pairing mechanism in cuprate superconductors remains an outstanding issue. The normal state properties, particularly in the underdoped region, have been found to be at odd with conventional metals which is usually described by Fermi liquid theory; instead, the normal state at optimal doping fits better with the marginal Fermi liquid phenomenology. Most notable is the observation of the pseudogap state in the underdoped region above T c . As in other strongly correlated electrons systems, these unusual properties stem from the interplay between electronic, magnetic, lattice and orbital degrees of freedom. Understanding the microscopic process involved in these materials and the interaction of electrons with other entities is essential to understand the mechanism of high temperature superconductivity. Since the discovery of high-T c superconductivity in cuprates, angle-resolved photoemission spectroscopy (ARPES) has provided key experimental insights in revealing the electronic structure of high temperature superconductors. These include, among others, the earliest identification of dispersion and a large Fermi surface, an anisotropic superconducting gap suggestive of a d-wave order parameter, and an observation of the pseudogap in underdoped samples. In the mean time, this technique itself has experienced a dramatic improvement in its energy and momentum resolutions, leading to a series of new discoveries not thought possible

  10. Design of a transmission electron positron microscope

    International Nuclear Information System (INIS)

    Doyama, Masao; Inoue, M.; Kogure, Y.; Hayashi, Y.; Yoshii, T.; Kurihara, T.; Tsuno, K.

    2003-01-01

    This paper reports the plans and design of positron-electron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan. A used electron microscope is altered. The kinetic energies of positrons produced by accelerators or by nuclear decays are not a unique value but show a spread over in a wide range. Positron beam is guided to a transmission electron microscope (JEM100SX). Positrons are moderated by a tungsten foil, are accelerated and are focused on a nickel sheet. The monochromatic focused beam is injected into an electron microscope. The focusing and aberration of positrons are the same as electrons in a magnetic system which are used in commercial electron microscopes. Imaging plates are used to record positron images for the transmission electron microscope. (author)

  11. Nanoscale spatial analysis of clay minerals containing cesium by synchrotron radiation photoemission electron microscopy

    Science.gov (United States)

    Yoshigoe, Akitaka; Shiwaku, Hideaki; Kobayashi, Toru; Shimoyama, Iwao; Matsumura, Daiju; Tsuji, Takuya; Nishihata, Yasuo; Kogure, Toshihiro; Ohkochi, Takuo; Yasui, Akira; Yaita, Tsuyoshi

    2018-01-01

    A synchrotron radiation photoemission electron microscope (SR-PEEM) was applied to demonstrate the pinpoint analysis of micrometer-sized weathered biotite clay particles with artificially adsorbed cesium (Cs) atoms. Despite the insulating properties of the clay, we observed the spatial distributions of constituent elements (Si, Al, Cs, Mg, and Fe) without charging issues and clarified reciprocal site-correlations among these elements with nanometer resolution. We found that Cs atoms were likely to be adsorbed evenly over the entire particle; however, we identified an occupational conflict between Cs and Mg atoms, implying that Cs sorption involves ion exchange processes. Spatially resolved X-ray absorption spectra (XAS) of the Cs4,5 M-edge region showed Cs to be present in a monocation state (Cs+) as typically observed for Cs compounds. Further pinpoint XAS measurements were also performed at the Fe L2,3-edge to determine the chemical valence of the Fe atoms. The shapes of the spectra were similar to those for Fe2O3, indicating that Fe in the clay was in a 3+ oxidation state. From these observations, we infer that charge compensation facilitates Cs adsorption in the vicinity of a substitution site where Si4+ ions are replaced by Fe3+ ions in SiO4 tetrahedral sheets. Our results demonstrate the utility of SR-PEEM as a tool for spatially resolved chemical analyses of various environmental substances, which is not limited by the poor conductivity of samples.

  12. X-ray photoemission electron microscopy for the study of semiconductor materials

    International Nuclear Information System (INIS)

    Anders, Simone; Stammler, Thomas; Padmore, Howard A.; Terminello, Louis J.; Jankowski, Alan F.; Stoehr, Joachim; Diaz, Javier; Cossy-Favre, Aline; Singh, Sangeet

    1998-01-01

    Photoemission Electron Microscopy using X-rays (X-PEEM) is a novel combination of two established materials analysis techniques--PEEM using UV light, and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy. This combination allows the study of elemental composition and bonding structure of the sample by NEXAFS spectroscopy with a high spatial resolution given by the microscope. A simple, two lens, 10 kV operation voltage PEEM has been used at the Stanford Synchrotron Radiation Laboratory and at the Advanced Light Source (ALS) in Berkeley to study various problems including materials of interest for the semiconductor industry. In the present paper we give a short overview over the method and the instrument which was used, and describe in detail a number of applications. These applications include the study of the different phases of titanium disilicide, various phases of boron nitride, and the analysis of small particles. A brief outlook is given on possible new fields of application of the PEEM technique, and the development of new PEEM instruments

  13. Scanning Electron Microscope Analysis System

    Data.gov (United States)

    Federal Laboratory Consortium — This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and...

  14. Electronic structure of Sr2RuO4 studied by angle-resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Iwasawa, H.; Aiura, Y.; Saitoh, T.; Yoshida, Y.; Hase, I.; Ikeda, S.I.; Bando, H.; Kubota, M.; Ono, K.

    2007-01-01

    Electronic structure of the monolayer strontium ruthenate Sr 2 RuO 4 was investigated by high-resolution angle-resolved photoemission spectroscopy. We present photon-energy (hν) dependence of the electronic structure near the Fermi level along the ΓM line. The hν dependence has shown a strong spectral weight modulation of the Ru 4d xy and 4d zx bands

  15. Observation of electron polarization above 80% in photoemission from strained III-V compounds

    International Nuclear Information System (INIS)

    Garwin, E.L.; Maruyama, T.; Prepost, R.; Zapalac, G.H.

    1992-02-01

    Spin-polarized electron photoemission has been investigated for strained III--V compounds; (1) strained In x Ga 1-x As epitaxially grown on a GaAs substrate, and (2) strained GaAs grown on a GaAs 1-x P x buffer layer. The lattice mismatched heterostructure results in a highly strained epitaxial layer, and electron spin polarization as high as 90% has been observed

  16. Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Fitzgerald, J.P.S., E-mail: fit@pdx.edu; Word, R.C.; Könenkamp, R.

    2016-01-15

    We present theoretical estimates of the mean coefficients of spherical and chromatic aberration for low energy photoemission electron microscopy (PEEM). Using simple analytic models, we find that the aberration coefficients depend primarily on the difference between the photon energy and the photoemission threshold, as expected. However, the shape of the photoelectron spectral distribution impacts the coefficients by up to 30%. These estimates should allow more precise correction of aberration in PEEM in experimental situations where the aberration coefficients and precise electron energy distribution cannot be readily measured. - Highlights: • Spherical and chromatic aberration coefficients of the accelerating field in PEEM. • Compact, analytic expressions for coefficients depending on two emission parameters. • Effect of an aperture stop on the distribution is also considered.

  17. Athermal electron distribution probed by femtosecond multiphoton photoemission from image potential states

    International Nuclear Information System (INIS)

    Ferrini, Gabriele; Giannetti, Claudio; Pagliara, Stefania; Banfi, Francesco; Galimberti, Gianluca; Parmigiani, Fulvio

    2005-01-01

    Image potential states are populated through indirect, scattering-mediated multiphoton absorption induced by femtosecond laser pulses and revealed by single-photon photoemission. The measured effective mass is significantly different from that obtained with direct, resonant population. These features reveal a strong coupling of the electrons residing in the image potential state, outside the solid, with the underlying hot electron population created by the laser pulse. The coupling is mediated by a many-body scattering interaction between the image potential state electrons and bulk electrons in highly excited states

  18. Photoemission study of electronic structure of the half-metallic ferromagnet Co₃Sn₂S₂

    OpenAIRE

    Holder, M.; Dedkov, Y.; Kade, A.; Rosner, H.; Schnelle, W.; Leithe-Jasper, A.; Weihrich, R.; Molodtsov, S.

    2009-01-01

    Surface electronic structure of polycrystalline and single-crystalline samples of the half-metallic ferromagnet Co₃Sn₂S₂ was studied by means of angle-resolved and core-level photoemissions. The experiments were performed in temperature regimes both above and below a Curie temperature of 176.9 K. The spectroscopic results are compared to local-spin density approximation band-structure calculations for the bulk samples. It is found that the surface sensitive experimental data are generally rep...

  19. Realisation of a ultra-high vacuum system and technique development of microscopical emitters preparation in silicium. First measurements of field emission current and field photoemission

    International Nuclear Information System (INIS)

    El Manouni, A.

    1990-12-01

    The development of research in the domain of photocathode (electron sources) illuminated by laser light to produce intense multiple bunches of electrons in short time is needed by many applications as linear collider e + e - , free electron laser, lasertron, etc... In this way, after a study of field emission, of photoemission and of photofield emission, we prepared microscopical emitters in silicium heavy and weakly doped a boron using a technique of microlithography. Then, we realized a system of ultra-high vacuum of studying property of emission from photocathodes realized. The experiment results obtained in field emission and photofield emission have shown that a behaviour unexpected for P-silicium tips array compared to P + -silicon tips array. With P-type silicon, a quantum yield of 21 percent has been measured for laser power of 140 mW and for applied field of 1.125 x 10 7 V/m and an instantaneous response to laser light beam has been observed. It has been noted that presence of oxyde at the surface of photocathode limits extensively the emission current. The fluctuations of emission current are due to quality of vacuum [fr

  20. Electron Microscope Center Opens at Berkeley.

    Science.gov (United States)

    Robinson, Arthur L.

    1981-01-01

    A 1.5-MeV High Voltage Electron Microscope has been installed at the Lawrence Berkeley Laboratory which will help materials scientists and biologists study samples in more true-to-life situations. A 1-MeV Atomic Resolution Microscope will be installed at the same location in two years which will allow scientists to distinguish atoms. (DS)

  1. Electronic structure of beta-FeSi sub 2 obtained by maximum entropy method and photoemission spectroscopy

    CERN Document Server

    Kakemoto, H; Makita, Y; Kino, Y; Tsukamoto, T; Shin, S; Wada, S; Tsurumi, T

    2003-01-01

    The electronic structure of beta-FeSi sub 2 was investigated by maximum entropy method (MEM) and photoemission spectroscopy. The electronic structure obtained by MEM using X-ray diffraction data at room temperature (RT) showed covalent bonds of Fe-Si and Si-Si electrons. The photoemission spectra of beta-FeSi sub 2 at RT were changed by incidence photon energies. For photon energies between 50 and 100 eV, resonant photoemission spectra caused by a super Coster-Kronig transition were observed. In order to reduce resonant effect about Fe(3d) for obtained photoemission spectra, difference spectrum between 53 and 57 eV was calculated, and it was compared with ab-initio band calculation and spectra function.

  2. Designs for a quantum electron microscope.

    Science.gov (United States)

    Kruit, P; Hobbs, R G; Kim, C-S; Yang, Y; Manfrinato, V R; Hammer, J; Thomas, S; Weber, P; Klopfer, B; Kohstall, C; Juffmann, T; Kasevich, M A; Hommelhoff, P; Berggren, K K

    2016-05-01

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This 'quantum weirdness' could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or "quantum electron microscope". A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. Copyright © 2016 The Authors. Published by Elsevier B.V. All rights reserved.

  3. Surface and volume photoemission of hot electrons from plasmonic nanoantennas

    DEFF Research Database (Denmark)

    Uskov, Alexander V.; Protsenko, Igor E.; Ikhsanov, Renat S.

    2014-01-01

    We theoretically compare surface- and volume-based photoelectron emission from spherical nanoparticles, obtaining analytical expressions for the emission rate in both mechanisms. We show that the surface mechanism prevails, being unaffected by detrimental hot electron collisions.......We theoretically compare surface- and volume-based photoelectron emission from spherical nanoparticles, obtaining analytical expressions for the emission rate in both mechanisms. We show that the surface mechanism prevails, being unaffected by detrimental hot electron collisions....

  4. Electronic Structures of Purple Bronze KMo6O17 Studied by X-Ray Photoemission Spectra

    Science.gov (United States)

    Qin, Xiaokui; Wei, Junyin; Shi, Jing; Tian, Mingliang; Chen, Hong; Tian, Decheng

    X-ray photoemission spectroscopy study has been performed for the purple bronze KMo6O17. The structures of conduction band and valence band are analogous to the results of ultraviolet photoemission spectra and are also consistent with the model of Travaglini et al., but the gap between conduction and valence band is insignificant. The shape of asymmetric and broadening line of O-1s is due to unresolved contributions from the many inequivalent oxygen sites in this crystal structure. Mo 3d core-level spectrum reveals that there are two kinds of valence states of Molybdenum (Mo+5 and Mo+6). The calculated average valence state is about +5.6, which is consistent with the expectation value from the composition of this material. The tail of Mo-3d spectrum toward higher binding energy is the consequence of the excitation of electron-hole pairs with singularity index of 0.21.

  5. Photoemission and the electronic properties of heavy fermions -- limitations of the Kondo model

    International Nuclear Information System (INIS)

    Joyce, J.J.; Arko, A.J.; Andrews, A.B.

    1993-01-01

    The electronic properties of Yb-based heavy fermions have been investigated by means of high resolution synchrotron radiation photoemission and compared with predictions of the Kondo model. The Yb heavy fermion photoemission spectra show massive disagreement with the Kondo model predictions (as calculated within the Gunnarsson-Schonhammer computational method). Moreover, the Yb heavy fermion photoemission spectra give very strong indications of core-like characteristics and compare favorable to purely divalent Yb metal and core-like Lu 4f levels. The heavy fermions YbCu 2 Si 2 , YbAgCu 4 and YbAl 3 were measured and shown to have lineshapes much broader and deeper in binding energy than predicted by the Kondo model. The lineshape of the bulk component of the 4f emission for these three heavy fermion materials was compared with that from Yb metal and the Lu 4f levels in LuAl 3 , the heavy fermion materials show no substantive spectroscopic differences from simple 4f levels observed in Yb metal and LuAl 3 . Also, the variation with temperature of the 4f fineshape was measured for Yb metal and clearly demonstrates that phonon broadening plays a major role in 4f level lineshape analysis and must be accounted for before considerations of correlated electron resonance effects are presumed to be at work

  6. Electron-electron correlation, resonant photoemission and X-ray emission spectra

    International Nuclear Information System (INIS)

    Parlebas, J.C.; Kotani, Akio; Tanaka, Satoshi.

    1991-01-01

    In this short review paper we essentially focus on the high energy spectroscopies which involve second order quantum processes, i.e., resonance photoemission, Auger and X-ray emission spectroscopies, denoted respectively by RXPS, AES and XES. First, we summarize the main 3p-RXPS and AES results obtained in Cu and Ni metals; especially we recall that the satellite near the 3p-threshold in the spectra, which arises from a d-hole pair bound state, needs a careful treatment of the electron-electron correlation. Then we analyze the RXPS spectra in a few Ce compounds (CeO 2 , Ce 2 O 3 and CeF 3 ) involving 3d or 4d core levels and we interpret the spectra consistently with the other spectroscopies, such as core XPS and XAS which are first order quantum processes. Finally within the same one-impurity model and basically with the same sets of parameters, we review a theory for the Ce 5p→3d XES, as well as for the corresponding RXES, where (1) the incident X-ray is tuned to resonate with the 3d→4f transition and (2) the X-ray emission due to the 5p→3d transition is actually observed. The paper ends with a general discussion. (author) 77 refs

  7. A study of Al/Si interface by photoemission, Auger electron yield and Auger electron spectroscopies

    International Nuclear Information System (INIS)

    Kobayashi, K.L.I.; Barth, J.; Gerken, F.; Kunz, C.; Deutsches Elektronen-Synchrotron

    1980-06-01

    Photoemission, Auger electron yield and Auger electron spectra were observed for Al/Si(111) interfaces with various Al coverage prepared by successive deposition using a molecular beam source. The Al 3p derived states are introduced at around the top of the valence band by the Al coverage of less than one monolayer. The Al surface layer behaves as a 'metal' and the Fermi level is stabilized in the Al 3p derived states at about 0.3 eV above the top of the valence band of Si. The Schottky barrier height in this stage is about 0.8 eV and further increase in Al coverage does not change the barrier height. A covalent bonding model of the Al/Si interface based on the experimental results is proposed. The present result favors the on-top geometry of Al atoms on Si(111) surface among the geometries used in the pseudopotential calculation by Zhang and Schlueter. (orig.)

  8. Electronic structure of metallic alloys through Auger and photoemission spectroscopy

    International Nuclear Information System (INIS)

    Kleiman, G.G.; Rogers, J.D.; Sundaram, V.S.

    1981-01-01

    A review is presented of experimental results of electron spectroscopy studies for various series of transition metal alloys as well as a model for their interpretation which leads to the possibility for the first time to determine independently relative variations in the dipole barrier and Fermi energy contributions to the work function. (L.C.) [pt

  9. Electron waves under the microscope

    International Nuclear Information System (INIS)

    Geim, A.

    2000-01-01

    If I were to explain to you what a velociraptor is, I would probably say that it looks like a small Tyrannosaurus rex and is about the same size as a dog. But what if you have never seen a picture of a T. rex? Every teacher or physicist trying to explain to students w hat an electron is'' has a similar, but more severe, problem. It usually takes months, if not years, of physics training to become familiar with imaginary pictures of electrons and then learn how to use them. Moreover, physicists need many different images depending on the phenomenon they want to address. However, in the last few years, real images of electron clouds and so-called quantum corrals have been taken. In the December issue of Physics World, Andrey Geim of the University of Manchester, UK, reveals how two recent experiments have allowed physicists to image electrons embedded deep inside semiconductors. (U.K.)

  10. X-ray imaging and spectroscopy of individual cobalt nanoparticles using photoemission electron microscopy

    International Nuclear Information System (INIS)

    Fraile Rodriguez, A.; Nolting, F.; Bansmann, J.; Kleibert, A.; Heyderman, L.J.

    2007-01-01

    Photoemission electron microscopy (PEEM) was employed for X-ray imaging and absorption spectroscopy of individual cobalt nanoparticles as small as 8 nm grown using an arc ion cluster source. Using lithographic markers on the samples we were able to identify the same particles with PEEM and scanning electron microscopy. Significant variations in the shape of the X-ray absorption spectra between different cobalt particles were detected. Furthermore, our data suggest that distinctive spectral information about the individual particles, such as the quenching of oxide-related features and changes in the cobalt L 3 -edge intensity, cancel out and cannot be detected in the measurement over an ensemble of particles

  11. Determination of electronic states in crystalline semiconductors and metals by angle-resolved photoemission

    International Nuclear Information System (INIS)

    Mills, K.A.

    1979-08-01

    An important part of the theoretical description of the solid state is band structure, which relies on the existence of dispersion relations connecting the electronic energy and wavevector in materials with translational symmetry. These relations determine the electronic behavior of such materials. The elaboration of accurate band structures, therefore, is of considerable fundamental and practical importance. Angle-resolved photoemission (ARP) spectroscopy provides the only presently available method for the detailed experimental investigation of band structures. This work is concerned with its application to both semiconducting and metallic single crystals

  12. Studies on a laser driven photoemissive high-brightness electron source and novel photocathodes

    International Nuclear Information System (INIS)

    Geng Rongli; Song Jinhu; Yu Jin

    1997-01-01

    A laser driven photoemissive high-brightness electron source at Beijing University is reported. Through a DC accelerating gap of 100 kV voltage, the device is capable of delivering high-brightness electron beam of 35-100 ps pulse duration when irradiated with a mode-locked YAG laser. The geometry of the gun is optimized with the aid of simulation codes EGUN and POISSON. The results of experimental studies on ion implanted photocathode and cesium telluride photocathode are given. The proposed laser driven superconducting RF gun is also discussed

  13. Vibrational spectroscopy in the electron microscope.

    Science.gov (United States)

    Krivanek, Ondrej L; Lovejoy, Tracy C; Dellby, Niklas; Aoki, Toshihiro; Carpenter, R W; Rez, Peter; Soignard, Emmanuel; Zhu, Jiangtao; Batson, Philip E; Lagos, Maureen J; Egerton, Ray F; Crozier, Peter A

    2014-10-09

    Vibrational spectroscopies using infrared radiation, Raman scattering, neutrons, low-energy electrons and inelastic electron tunnelling are powerful techniques that can analyse bonding arrangements, identify chemical compounds and probe many other important properties of materials. The spatial resolution of these spectroscopies is typically one micrometre or more, although it can reach a few tens of nanometres or even a few ångströms when enhanced by the presence of a sharp metallic tip. If vibrational spectroscopy could be combined with the spatial resolution and flexibility of the transmission electron microscope, it would open up the study of vibrational modes in many different types of nanostructures. Unfortunately, the energy resolution of electron energy loss spectroscopy performed in the electron microscope has until now been too poor to allow such a combination. Recent developments that have improved the attainable energy resolution of electron energy loss spectroscopy in a scanning transmission electron microscope to around ten millielectronvolts now allow vibrational spectroscopy to be carried out in the electron microscope. Here we describe the innovations responsible for the progress, and present examples of applications in inorganic and organic materials, including the detection of hydrogen. We also demonstrate that the vibrational signal has both high- and low-spatial-resolution components, that the first component can be used to map vibrational features at nanometre-level resolution, and that the second component can be used for analysis carried out with the beam positioned just outside the sample--that is, for 'aloof' spectroscopy that largely avoids radiation damage.

  14. Spectroscopy of electron irradiated polymers in electron microscope

    International Nuclear Information System (INIS)

    Faraj, S.H.; Salih, S.M.

    1981-01-01

    The damage induced by energetic electrons in the course of irradiation of polymers in a transmission electron microscope was investigated spectroscopically. Damage on the molecular level has been detected at very low exposure doses. These effects have been induced by electron doses less than that received by the specimen when it is situated at its usual place of the specimen stage in the electron microscope by a factor of 1,000. (author)

  15. Image enhancement in photoemission electron microscopy by means of imaging time-of-flight analysis

    International Nuclear Information System (INIS)

    Oelsner, A.; Krasyuk, A.; Fecher, G.H.; Schneider, C.M.; Schoenhense, G.

    2004-01-01

    Photoemission electron microscopy (PEEM) is widely used in combination with synchrotron sources as a powerful tool to observe chemical and magnetic properties of metal and semiconductor surfaces. Presently, the resolution limit of these instruments using soft-X-ray excitation is limited to about 50 nm, because of the chromatic aberration of the electron optics used. Various sophisticated approaches have thus been reported for enhancing the spatial resolution in photoemission electron microscopy. This work demonstrates the use of a simple imaging energy filter based on electron time-of-flight (ToF) selection. The spatial resolution could be improved dramatically, even though the instrument was optimized using a rather large contrast aperture of 50 μm. A special (x, y, t)-resolving delayline detector was used as the imaging unit of this ToF-PEEM. It is operated in phase with the time structure of the synchrotron source, cutting time intervals from the raw image-forming data set in order to reduce the electron energy width contributing to the final images

  16. Rotatable spin-polarized electron source for inverse-photoemission experiments

    International Nuclear Information System (INIS)

    Stolwijk, S. D.; Wortelen, H.; Schmidt, A. B.; Donath, M.

    2014-01-01

    We present a ROtatable Spin-polarized Electron source (ROSE) for the use in spin- and angle-resolved inverse-photoemission (SR-IPE) experiments. A key feature of the ROSE is a variable direction of the transversal electron beam polarization. As a result, the inverse-photoemission experiment becomes sensitive to two orthogonal in-plane polarization directions, and, for nonnormal electron incidence, to the out-of-plane polarization component. We characterize the ROSE and test its performance on the basis of SR-IPE experiments. Measurements on magnetized Ni films on W(110) serve as a reference to demonstrate the variable spin sensitivity. Moreover, investigations of the unoccupied spin-dependent surface electronic structure of Tl/Si(111) highlight the capability to analyze complex phenomena like spin rotations in momentum space. Essentially, the ROSE opens the way to further studies on complex spin-dependent effects in the field of surface magnetism and spin-orbit interaction at surfaces

  17. A novel probe of intrinsic electronic structure: hard X-ray photoemission spectroscopy

    International Nuclear Information System (INIS)

    Takata, Y.; Tamasaku, K.; Nishino, Y.; Miwa, D.; Yabashi, M.; Ikenaga, E.; Horiba, K.; Arita, M.; Shimada, K.; Namatame, H.; Nohira, H.; Hattori, T.; Soedergren, S.; Wannberg, B.; Taniguchi, M.; Shin, S.; Ishikawa, T.; Kobayashi, K.

    2005-01-01

    We have realized hard X-ray (HX) photoemission spectroscopy (PES) with high throughput and high-energy resolution for core level and valence band studies using high-energy and high-brilliance synchrotron radiation at SPring-8. This is a brand new method because large escape depth of high-energy photoelectrons enables us to probe intrinsic bulk states free from surface condition. By use of a newly developed electron energy analyzer and well-focused X-rays, high-energy resolution of 75 meV (E/ΔE 79,000) was realized for 5.95 keV photoelectrons

  18. Electronic structure of superconducting Bi2212 crystal by angle resolved ultra violet photoemission

    International Nuclear Information System (INIS)

    Saini, N.L.; Shrivastava, P.; Garg, K.B.

    1993-01-01

    The electronic structure of a high quality superconducting Bi 2 Sr 2 CaCu 2 Osub(8+δ) (Bi2212) single crystal is studied by angle resolved ultra violet photoemission (ARUPS) using He I (21.2 eV). Our results appear to show two bands crossing the Fermi level in ΓX direction of the Brillouin zone as reported by Takahashi et al. The bands at higher binding energy do not show any appreciable dispersion. The nature of the states near the Fermi level is discussed and the observed band structure is compared with the band structure calculations. (author)

  19. Transmission electron microscope studies of extraterrestrial materials

    Science.gov (United States)

    Keller, Lindsay P.

    1995-01-01

    Transmission Electron Microscopy, X-Ray spectrometry and electron-energy-loss spectroscopy are used to analyse carbon in interplanetary dust particles. Optical micrographs are shown depicting cross sections of the dust particles embedded in sulphur. Selected-area electron diffraction patterns are shown. Transmission Electron Microscope specimens of lunar soil were prepared using two methods: ion-milling and ultramicrotomy. A combination of high resolution TEM imaging and electron diffraction is used to characterize the opaque assemblages. The opaque assemblages analyzed in this study are dominated by ilmenite with lesser rutile and spinel exsolutions, and traces of Fe metal.

  20. Designs for a quantum electron microscope

    International Nuclear Information System (INIS)

    Kruit, P.; Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R.; Hammer, J.; Thomas, S.; Weber, P.; Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A.; Hommelhoff, P.; Berggren, K.K.

    2016-01-01

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

  1. Designs for a quantum electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kruit, P., E-mail: p.kruit@tudelft.nl [Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJ Delft (Netherlands); Hobbs, R.G.; Kim, C-S.; Yang, Y.; Manfrinato, V.R. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States); Hammer, J.; Thomas, S.; Weber, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Klopfer, B.; Kohstall, C.; Juffmann, T.; Kasevich, M.A. [Department of Physics, Stanford University, Stanford, California 94305 (United States); Hommelhoff, P. [Department of Physics, Friedrich Alexander University Erlangen-Nürnberg (FAU), Staudtstrasse 1, d-91058 Erlangen (Germany); Berggren, K.K. [Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)

    2016-05-15

    One of the astounding consequences of quantum mechanics is that it allows the detection of a target using an incident probe, with only a low probability of interaction of the probe and the target. This ‘quantum weirdness’ could be applied in the field of electron microscopy to generate images of beam-sensitive specimens with substantially reduced damage to the specimen. A reduction of beam-induced damage to specimens is especially of great importance if it can enable imaging of biological specimens with atomic resolution. Following a recent suggestion that interaction-free measurements are possible with electrons, we now analyze the difficulties of actually building an atomic resolution interaction-free electron microscope, or “quantum electron microscope”. A quantum electron microscope would require a number of unique components not found in conventional transmission electron microscopes. These components include a coherent electron beam-splitter or two-state-coupler, and a resonator structure to allow each electron to interrogate the specimen multiple times, thus supporting high success probabilities for interaction-free detection of the specimen. Different system designs are presented here, which are based on four different choices of two-state-couplers: a thin crystal, a grating mirror, a standing light wave and an electro-dynamical pseudopotential. Challenges for the detailed electron optical design are identified as future directions for development. While it is concluded that it should be possible to build an atomic resolution quantum electron microscope, we have also identified a number of hurdles to the development of such a microscope and further theoretical investigations that will be required to enable a complete interpretation of the images produced by such a microscope. - Highlights: • Quantum electron microscopy has the potential of reducing radiation damage. • QEM requires a fraction of the electron wave to pass through the sample

  2. Development of Scanning Ultrafast Electron Microscope Capability.

    Energy Technology Data Exchange (ETDEWEB)

    Collins, Kimberlee Chiyoko [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Talin, Albert Alec [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Chandler, David W. [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Michael, Joseph R. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2016-11-01

    Modern semiconductor devices rely on the transport of minority charge carriers. Direct examination of minority carrier lifetimes in real devices with nanometer-scale features requires a measurement method with simultaneously high spatial and temporal resolutions. Achieving nanometer spatial resolutions at sub-nanosecond temporal resolution is possible with pump-probe methods that utilize electrons as probes. Recently, a stroboscopic scanning electron microscope was developed at Caltech, and used to study carrier transport across a Si p-n junction [ 1 , 2 , 3 ] . In this report, we detail our development of a prototype scanning ultrafast electron microscope system at Sandia National Laboratories based on the original Caltech design. This effort represents Sandia's first exploration into ultrafast electron microscopy.

  3. Study of Scanning Tunneling Microscope control electronics

    International Nuclear Information System (INIS)

    Oliva, A.J.; Pancarobo, M.; Denisenko, N.; Aguilar, M.; Rejon, V.; Pena, J.L.

    1994-01-01

    A theoretical study of Scanning Tunneling Microscope control electronics is made. The knowledge of its behaviour allows us to determine accurately the region where the unstable operation could effect the measurements, and also to set the optimal working parameters. Each feedback circuitry compound is discussed as well as their mutual interaction. Different working conditions analysis and results are presented. (Author) 12 refs

  4. The Titan Environmental Transmission Electron Microscope

    DEFF Research Database (Denmark)

    Hansen, Thomas Willum; Wagner, Jakob Birkedal; Jinschek, Jörg R.

    2009-01-01

    University of Denmark (DTU) provides a unique combination of techniques for studying materials of interest to the catalytic as well as the electronics and other communities [5]. DTU’s ETEM is based on the FEI Titan platform providing ultrahigh microscope stability pushing the imaging resolution into the sub...

  5. Exploring the environmental transmission electron microscope

    DEFF Research Database (Denmark)

    Wagner, Jakob B.; Cavalca, Filippo; Damsgaard, Christian D.

    2012-01-01

    of the opportunities that the environmental TEM (ETEM) offers when combined with other in situ techniques will be explored, directly in the microscope, by combining electron-based and photon-based techniques and phenomena. In addition, application of adjacent setups using sophisticated transfer methods...

  6. a Study on SODIUM(110) and Other Nearly Free Electron Metals Using Angle Resolved Photoemission Spectroscopy.

    Science.gov (United States)

    Lyo, In-Whan

    Electronic properties of the epitaxially grown Na(110) film have been studied using angle resolved ultraviolet photoemission spectroscopy with synchrotron radiation as the light source. Na provides an ideal ground to study the fundamental aspects of the electron-electron interactions in metals, because of its simple Fermi surface and small pseudopotential. The absolute band structure of Na(110) using angle resolved photoemission spectroscopy has been mapped out using the extrema searching method. The advantage of this approach is that the usual assumption of the unoccupied state dispersion is not required. We have found that the dispersion of Na(1l0) is very close to the parabolic band with the effective mass 1.21 M_{rm e} at 90 K. Self-consistent calculations of the self-energy for the homogeneous electron gas have been performed using the Green's function technique within the framework of the GW approximation, in the hope of understanding the narrowing mechanism of the bandwidth observed for all the nearly-free-electron (NFE) metals. Good agreements between the experimental data and our calculated self-energy were obtained not only for our data on k-dependency from Na(l10), but also for the total bandwidth corrections for other NFE metals, only if dielectric functions beyond the random phase approximation were used. Our findings emphasize the importance of the screening by long wavelength plasmons. Off-normal spectra of angle resolved photoemission from Na(110) show strong asymmetry of the bulk peak intensity for the wide range of photon energies. Using a simple analysis, we show this asymmetry has an origin in the interference of the surface Umklapp electrons with the normal electrons. We have also performed the detailed experimental studies of the anomalous Fermi level structure observed in the forbidden gap region of Na. This was claimed by A. W. Overhauser as the evidence of the charge density wave in the alkali metal. The possibility of this hypothesis is

  7. Electron Band Alignment at Interfaces of Semiconductors with Insulating Oxides: An Internal Photoemission Study

    Directory of Open Access Journals (Sweden)

    Valeri V. Afanas'ev

    2014-01-01

    Full Text Available Evolution of the electron energy band alignment at interfaces between different semiconductors and wide-gap oxide insulators is examined using the internal photoemission spectroscopy, which is based on observations of optically-induced electron (or hole transitions across the semiconductor/insulator barrier. Interfaces of various semiconductors ranging from the conventional silicon to the high-mobility Ge-based (Ge, Si1-xGex, Ge1-xSnx and AIIIBV group (GaAs, InxGa1-xAs, InAs, GaP, InP, GaSb, InSb materials were studied revealing several general trends in the evolution of band offsets. It is found that in the oxides of metals with cation radii larger than ≈0.7 Å, the oxide valence band top remains nearly at the same energy (±0.2 eV irrespective of the cation sort. Using this result, it becomes possible to predict the interface band alignment between oxides and semiconductors as well as between dissimilar insulating oxides on the basis of the oxide bandgap width which are also affected by crystallization. By contrast, oxides of light elements, for example, Be, Mg, Al, Si, and Sc exhibit significant shifts of the valence band top. General trends in band lineup variations caused by a change in the composition of semiconductor photoemission material are also revealed.

  8. Visualizing electron dynamics in organic materials: Charge transport through molecules and angular resolved photoemission

    Science.gov (United States)

    Kümmel, Stephan

    Being able to visualize the dynamics of electrons in organic materials is a fascinating perspective. Simulations based on time-dependent density functional theory allow to realize this hope, as they visualize the flow of charge through molecular structures in real-space and real-time. We here present results on two fundamental processes: Photoemission from organic semiconductor molecules and charge transport through molecular structures. In the first part we demonstrate that angular resolved photoemission intensities - from both theory and experiment - can often be interpreted as a visualization of molecular orbitals. However, counter-intuitive quantum-mechanical electron dynamics such as emission perpendicular to the direction of the electrical field can substantially alter the picture, adding surprising features to the molecular orbital interpretation. In a second study we calculate the flow of charge through conjugated molecules. The calculations show in real time how breaks in the conjugation can lead to a local buildup of charge and the formation of local electrical dipoles. These can interact with neighboring molecular chains. As a consequence, collections of ''molecular electrical wires'' can show distinctly different characteristics than ''classical electrical wires''. German Science Foundation GRK 1640.

  9. Isotope analysis in the transmission electron microscope.

    Science.gov (United States)

    Susi, Toma; Hofer, Christoph; Argentero, Giacomo; Leuthner, Gregor T; Pennycook, Timothy J; Mangler, Clemens; Meyer, Jannik C; Kotakoski, Jani

    2016-10-10

    The Ångström-sized probe of the scanning transmission electron microscope can visualize and collect spectra from single atoms. This can unambiguously resolve the chemical structure of materials, but not their isotopic composition. Here we differentiate between two isotopes of the same element by quantifying how likely the energetic imaging electrons are to eject atoms. First, we measure the displacement probability in graphene grown from either 12 C or 13 C and describe the process using a quantum mechanical model of lattice vibrations coupled with density functional theory simulations. We then test our spatial resolution in a mixed sample by ejecting individual atoms from nanoscale areas spanning an interface region that is far from atomically sharp, mapping the isotope concentration with a precision better than 20%. Although we use a scanning instrument, our method may be applicable to any atomic resolution transmission electron microscope and to other low-dimensional materials.

  10. Science 101: How Does an Electron Microscope Work?

    Science.gov (United States)

    Robertson, Bill

    2013-01-01

    Contrary to popular opinion, electron microscopes are not used to look at electrons. They are used to look for structure in things that are too small to observe with an optical microscope, or to obtain images that are magnified much more than is obtainable with an optical microscope. To understand how electron microscopes work, it will help to go…

  11. Electronic structure of Mo1-x Re x alloys studied through resonant photoemission spectroscopy

    Science.gov (United States)

    Sundar, Shyam; Banik, Soma; Sharath Chandra, L. S.; Chattopadhyay, M. K.; Ganguli, Tapas; Lodha, G. S.; Pandey, Sudhir K.; Phase, D. M.; Roy, S. B.

    2016-08-01

    We studied the electronic structure of Mo-rich Mo1-x Re x alloys (0≤slant x≤slant 0.4 ) using valence band photoemission spectroscopy in the photon energy range 23-70 eV and density of states calculations. Comparison of the photoemission spectra with the density of states calculations suggests that, with respect to the Fermi level E F, the d states lie mostly in the binding energy range 0 to  -6 eV, whereas s states lie in the binding energy range  -4 to  -10 eV. We observed two resonances in the photoemission spectra of each sample, one at about 35 eV photon energy and the other at about 45 eV photon energy. Our analysis suggests that the resonance at 35 eV photon energy is related to the Mo 4p-5s transition and the resonance at 45 eV photon energy is related to the contribution from both the Mo 4p-4d transition (threshold: 42 eV) and the Re 5p-5d transition (threshold: 46 eV). In the constant initial state plot, the resonance at 35 eV incident photon energy for binding energy features in the range E F (BE  =  0) to  -5 eV becomes progressively less prominent with increasing Re concentration x and vanishes for x  >  0.2. The difference plots obtained by subtracting the valence band photoemission spectrum of Mo from that of Mo1-x Re x alloys, measured at 47 eV photon energy, reveal that the Re d-like states appear near E F when Re is alloyed with Mo. These results indicate that interband s-d interaction, which is weak in Mo, increases with increasing x and influences the nature of the superconductivity in alloys with higher x.

  12. Transmission Electron Microscope Measures Lattice Parameters

    Science.gov (United States)

    Pike, William T.

    1996-01-01

    Convergent-beam microdiffraction (CBM) in thermionic-emission transmission electron microscope (TEM) is technique for measuring lattice parameters of nanometer-sized specimens of crystalline materials. Lattice parameters determined by use of CBM accurate to within few parts in thousand. Technique developed especially for use in quantifying lattice parameters, and thus strains, in epitaxial mismatched-crystal-lattice multilayer structures in multiple-quantum-well and other advanced semiconductor electronic devices. Ability to determine strains in indivdual layers contributes to understanding of novel electronic behaviors of devices.

  13. Ponderomotive phase plate for transmission electron microscopes

    Science.gov (United States)

    Reed, Bryan W [Livermore, CA

    2012-07-10

    A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.

  14. Electronic properties of Mn-phthalocyanine–C60 bulk heterojunctions: Combining photoemission and electron energy-loss spectroscopy

    International Nuclear Information System (INIS)

    Roth, Friedrich; Herzig, Melanie; Knupfer, Martin; Lupulescu, Cosmin; Darlatt, Erik; Gottwald, Alexander; Eberhardt, Wolfgang

    2015-01-01

    The electronic properties of co-evaporated mixtures (blends) of manganese phthalocyanine and the fullerene C 60 (MnPc:C 60 ) have been studied as a function of the concentration of the two constituents using two supplementary electron spectroscopic methods, photoemission spectroscopy (PES) and electron energy-loss spectroscopy (EELS) in transmission. Our PES measurements provide a detailed picture of the electronic structure measured with different excitation energies as well as different mixing ratios between MnPc and C 60 . Besides a relative energy shift, the occupied electronic states of the two materials remain essentially unchanged. The observed energy level alignment is different compared to that of the related CuPc:C 60 bulk heterojunction. Moreover, the results from our EELS investigations show that, despite the rather small interface interaction, the MnPc related electronic excitation spectrum changes significantly by admixing C 60 to MnPc thin films

  15. X-ray photoemission electron microscopy, a tool for the investigation of complex magnetic structures

    International Nuclear Information System (INIS)

    Scholl, Andreas; Ohldag, Hendrik; Nolting, Frithjof; Stohr, Joachim; Padmore, Howard A.

    2001-01-01

    X-ray Photoemission Electron Microscopy unites the chemical specificity and magnetic sensitivity of soft x-ray absorption techniques with the high spatial resolution of electron microscopy. The discussed instrument possesses a spatial resolution of better than 50 nm and is located at a bending magnet beamline at the Advanced Light Source, providing linearly and circularly polarized radiation between 250 and 1300 eV. We will present examples which demonstrate the power of this technique applied to problems in the field of thin film magnetism. The chemical and elemental specificity is of particular importance for the study of magnetic exchange coupling because it allows separating the signal of the different layers and interfaces in complex multi-layered structures

  16. Interfacial electronic structure of Na deposited on rubrene thin film studied by synchrotron radiation photoemission

    International Nuclear Information System (INIS)

    Wei, Ching-Hsuan; Cheng, Chiu-Ping; Lin, Hong-Cheu; Pi, Tun-Wen

    2015-01-01

    Graphical abstract: - Highlights: • Na deposited on rubrene had undergone three-stage development process via (1) atomic diffusion, (2) atomic incorporation in the surface region, (3) formation of a metallic film. • High resolution core-level photoemission was used to determine the location of the doped Na atoms, which is affiliated at the end position of the tetracene-like backbone. • Na metal was formed on the rubrene thin film. • Ionization potential of the organic molecule regulated with different Na doping concentration could be controllable and favorable in practical applications. - Abstract: The electronic structure of rubrene doped with various concentrations of Na was studied by synchrotron-radiation photoemission. Three stages of development were found with increasing Na concentration; Na penetrating deep into the organic film, followed by development of gap states, and ended with a metallic Na film. The charge transfer from Na to rubrene resulted in a vacuum-level shift. By doping Na into rubrene, we could control the IP of the organic molecule, which is favorable for application in organic semiconductor devices.

  17. Atmospheric scanning electron microscope for correlative microscopy.

    Science.gov (United States)

    Morrison, Ian E G; Dennison, Clare L; Nishiyama, Hidetoshi; Suga, Mitsuo; Sato, Chikara; Yarwood, Andrew; O'Toole, Peter J

    2012-01-01

    The JEOL ClairScope is the first truly correlative scanning electron and optical microscope. An inverted scanning electron microscope (SEM) column allows electron images of wet samples to be obtained in ambient conditions in a biological culture dish, via a silicon nitride film window in the base. A standard inverted optical microscope positioned above the dish holder can be used to take reflected light and epifluorescence images of the same sample, under atmospheric conditions that permit biochemical modifications. For SEM, the open dish allows successive staining operations to be performed without moving the holder. The standard optical color camera used for fluorescence imaging can be exchanged for a high-sensitivity monochrome camera to detect low-intensity fluorescence signals, and also cathodoluminescence emission from nanophosphor particles. If these particles are applied to the sample at a suitable density, they can greatly assist the task of perfecting the correlation between the optical and electron images. Copyright © 2012 Elsevier Inc. All rights reserved.

  18. Digital management of an electron microscope unit

    International Nuclear Information System (INIS)

    Elea, N.; Dickson, M.; Munroe, P.

    2002-01-01

    Full text: Electron microscope units, especially those such as ours, which operate as a central infrastructural facility are increasingly asked to provide more service, over more instruments with decreasing, or limited, financial resources. We believe that staff time is best used performing electron microscopy, assisting users and maintaining instrumentation rather than in the pursuit of red tape. One solution to this problem has been the creation of a control system which performs all routine acts of data management, such as the archiving and accessing of digital data, providing access to bookings, and most importantly in the era of user pays services, logging time and billing users. The system we have created, developed and expanded allows the users themselves to access our server through any web-browser and make their own bookings or access and manipulate their data. Users themselves must log on to a microscope through swipecard readers before it can be used and log-off after use. Their time is logged precisely and an exquisitely fair user pays systems can be operated by transferring logged usage time to spreadsheets to calculate charges. Furthermore, this system acts as a method of user authentication and can be used to bar incompetent or unauthorised users. The system has recently been upgraded to increase its utility to include sensors that monitor the electron microscope operating environment, such as magnetic field, room temperature, water flow etc, so that if these parameters depart significantly from optimum levels electron microscope unit staff may be alerted. In this presentation the structure of our system will be described and the advantages and disadvantages of such a system will be discussed. Copyright (2002) Australian Society for Electron Microscopy Inc

  19. Electron microscopic radioautography of the cell

    International Nuclear Information System (INIS)

    Sarkisov, D.S.; Pal'tsyn, A.A.; Vtyurin, B.V.

    1980-01-01

    This monograph is the first one in the world literature that gives th generalised experience in application of the up-to-date method of structural and functional analysis, i.e. of electron-microscopic autography to study the dynamics of intracellular processes under normal conditions as well as under some pathogenic effects. Given herein are the data on synthesis of DNA and RNA in various structures of the nucleus, particularly in nucleoli, the regularities of the synthesis processes in the organellae of the same name are discussed; illustrated are the possibilities of structure analysis of biosynthesis intensity variations in the nucleus and cytoplasma in cells of liver miocardium, granulation tissue at different stages of morphological process; the results of electron-microscopic radioautography application in study of clinical biopsy material are given and the data obtained are discussed in the light of general pathology problems

  20. Electron spin resonance scanning tunneling microscope

    International Nuclear Information System (INIS)

    Guo Yang; Li Jianmei; Lu Xinghua

    2015-01-01

    It is highly expected that the future informatics will be based on the spins of individual electrons. The development of elementary information unit will eventually leads to novel single-molecule or single-atom devices based on electron spins; the quantum computer in the future can be constructed with single electron spins as the basic quantum bits. However, it is still a great challenge in detection and manipulation of a single electron spin, as well as its coherence and entanglement. As an ideal experimental tool for such tasks, the development of electron spin resonance scanning tunneling microscope (ESR-STM) has attracted great attention for decades. This paper briefly introduces the basic concept of ESR-STM. The development history of this instrument and recent progresses are reviewed. The underlying mechanism is explored and summarized. The challenges and possible solutions are discussed. Finally, the prospect of future direction and applications are presented. (authors)

  1. French contributions to electron microscopic radioautography

    International Nuclear Information System (INIS)

    Droz, B.

    1994-01-01

    The radio autographic contributions carried out by electron microscopists took a part to improve the methodology and to extend applications to major biological problems. As underlined by CP Leblonc radioautography has clarified the importance of renewing systems; one may truly say that radioautography has introduced the time dimension in histology. The sites of biosynthesis of different substances have been located on the sub cellar scale, and it is now possible to analyse the molecular migrations within cells. The development of in situ hybridization and of receptors binding sites at the ultrastructural level has enlarged the application field of electron microscope radioautography. 64 refs., 2 figs

  2. Common Features in Electronic Structure of the Oxypnictide Superconductors from Photoemission Spectroscopy

    International Nuclear Information System (INIS)

    Xiao-Wen, Jia; Hai-Yun, Liu; Wen-Tao, Zhang; Lin, Zhao; Jian-Qiao, Meng; Guo-Dong, Liu; Xiao-Li, Dong; Zhi-An, Ren; Wei, Yi; Guang-Can, Che; Zhong-Xian, Zhao; Gang, Wu; Rong-Hua, Liu; Xian-Hui, Chen; Gen-Fu, Chen; Nan-Lin, Wang; Yong, Zhu; Xiao-Yang, Wang; Gui-Ling, Wang; Yong, Zhou

    2008-01-01

    High resolution photoemission measurements are carried out on non-superconducting LaFeAsO parent compound and various superconducting RFeAs(O 1-x F x ) (R=La, Ce and Pr) compounds. It is found that the parent LaFeAsO compound shows a metallic character. By extensive measurements, several common features are identified in the electronic structure of these Fe-based compounds: (1) 0.2 eV feature in the valence band, (2) a universal 13-16 meV feature, (3) near Ef spectral weight suppression with decreasing temperature. These universal features can provide important information about band structure, superconducting gap and pseudogap in these Fe-based materials

  3. Electronic structure investigation of atomic layer deposition ruthenium(oxide) thin films using photoemission spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Schaefer, Michael, E-mail: mvschaefer@mail.usf.edu, E-mail: schlaf@mail.usf.edu [Department of Physics, University of South Florida, Tampa, Florida 33620 (United States); Schlaf, Rudy, E-mail: mvschaefer@mail.usf.edu, E-mail: schlaf@mail.usf.edu [Department of Electrical Engineering, University of South Florida, Tampa, Florida 33620 (United States)

    2015-08-14

    Analyzing and manipulating the electronic band line-up of interfaces in novel micro- and nanoelectronic devices is important to achieve further advancement in this field. Such band alignment modifications can be achieved by introducing thin conformal interfacial dipole layers. Atomic layer deposition (ALD), enabling angstrom-precise control over thin film thickness, is an ideal technique for this challenge. Ruthenium (Ru{sup 0}) and its oxide (RuO{sub 2}) have gained interest in the past decade as interfacial dipole layers because of their favorable properties like metal-equivalent work functions, conductivity, etc. In this study, initial results of the electronic structure investigation of ALD Ru{sup 0} and RuO{sub 2} films via photoemission spectroscopy are presented. These experiments give insight into the band alignment, growth behavior, surface structure termination, and dipole formation. The experiments were performed in an integrated vacuum system attached to a home-built, stop-flow type ALD reactor without exposing the samples to the ambient in between deposition and analysis. Bis(ethylcyclopentadienyl)ruthenium(II) was used as precursor and oxygen as reactant. The analysis chamber was outfitted with X-ray photoemission spectroscopy (LIXPS, XPS). The determined growth modes are consistent with a strong growth inhibition situation with a maximum average growth rate of 0.21 Å/cycle for RuO{sub 2} and 0.04 Å/cycle for Ru.{sup 0} An interface dipole of up to −0.93 eV was observed, supporting the assumption of a strongly physisorbed interface. A separate experiment where the surface of a RuO film was sputtered suggests that the surface is terminated by an intermediate, stable, non-stoichiometric RuO{sub 2}/OH compound whose surface is saturated with hydroxyl groups.

  4. Electronic structure investigation of atomic layer deposition ruthenium(oxide) thin films using photoemission spectroscopy

    Science.gov (United States)

    Schaefer, Michael; Schlaf, Rudy

    2015-08-01

    Analyzing and manipulating the electronic band line-up of interfaces in novel micro- and nanoelectronic devices is important to achieve further advancement in this field. Such band alignment modifications can be achieved by introducing thin conformal interfacial dipole layers. Atomic layer deposition (ALD), enabling angstrom-precise control over thin film thickness, is an ideal technique for this challenge. Ruthenium (Ru0) and its oxide (RuO2) have gained interest in the past decade as interfacial dipole layers because of their favorable properties like metal-equivalent work functions, conductivity, etc. In this study, initial results of the electronic structure investigation of ALD Ru0 and RuO2 films via photoemission spectroscopy are presented. These experiments give insight into the band alignment, growth behavior, surface structure termination, and dipole formation. The experiments were performed in an integrated vacuum system attached to a home-built, stop-flow type ALD reactor without exposing the samples to the ambient in between deposition and analysis. Bis(ethylcyclopentadienyl)ruthenium(II) was used as precursor and oxygen as reactant. The analysis chamber was outfitted with X-ray photoemission spectroscopy (LIXPS, XPS). The determined growth modes are consistent with a strong growth inhibition situation with a maximum average growth rate of 0.21 Å/cycle for RuO2 and 0.04 Å/cycle for Ru.0 An interface dipole of up to -0.93 eV was observed, supporting the assumption of a strongly physisorbed interface. A separate experiment where the surface of a RuO film was sputtered suggests that the surface is terminated by an intermediate, stable, non-stoichiometric RuO2/OH compound whose surface is saturated with hydroxyl groups.

  5. Electronic structure investigation of atomic layer deposition ruthenium(oxide) thin films using photoemission spectroscopy

    International Nuclear Information System (INIS)

    Schaefer, Michael; Schlaf, Rudy

    2015-01-01

    Analyzing and manipulating the electronic band line-up of interfaces in novel micro- and nanoelectronic devices is important to achieve further advancement in this field. Such band alignment modifications can be achieved by introducing thin conformal interfacial dipole layers. Atomic layer deposition (ALD), enabling angstrom-precise control over thin film thickness, is an ideal technique for this challenge. Ruthenium (Ru 0 ) and its oxide (RuO 2 ) have gained interest in the past decade as interfacial dipole layers because of their favorable properties like metal-equivalent work functions, conductivity, etc. In this study, initial results of the electronic structure investigation of ALD Ru 0 and RuO 2 films via photoemission spectroscopy are presented. These experiments give insight into the band alignment, growth behavior, surface structure termination, and dipole formation. The experiments were performed in an integrated vacuum system attached to a home-built, stop-flow type ALD reactor without exposing the samples to the ambient in between deposition and analysis. Bis(ethylcyclopentadienyl)ruthenium(II) was used as precursor and oxygen as reactant. The analysis chamber was outfitted with X-ray photoemission spectroscopy (LIXPS, XPS). The determined growth modes are consistent with a strong growth inhibition situation with a maximum average growth rate of 0.21 Å/cycle for RuO 2 and 0.04 Å/cycle for Ru. 0 An interface dipole of up to −0.93 eV was observed, supporting the assumption of a strongly physisorbed interface. A separate experiment where the surface of a RuO film was sputtered suggests that the surface is terminated by an intermediate, stable, non-stoichiometric RuO 2 /OH compound whose surface is saturated with hydroxyl groups

  6. Indigenous development of scanning electron microscope

    International Nuclear Information System (INIS)

    Ambastha, K.P.; Chaudhari, Y.V.; Pal, Suvadip; Tikaria, Amit; Pious, Lizy; Dubey, B.P.; Chadda, V.K.

    2009-01-01

    Scanning electron microscope (SEM) is a precision instrument and plays very important role in scientific studies. Bhabha Atomic Research Centre has taken up the job of development of SEM indigenously. Standard and commercially available components like computer, high voltage power supply, detectors etc. shall be procured from market. Focusing and scanning coils, vacuum chamber, specimen stage, control hardware and software etc. shall be developed at BARC with the help of Indian industry. Procurement, design and fabrication of various parts of SEM are in progress. (author)

  7. Electron microscope studies on nuclear track filters

    International Nuclear Information System (INIS)

    Roell, I.; Siegmon, W.

    1982-01-01

    Nuclear track filters became more and more important in various fields of application. The filtration process can be described by a set of suitable parameters. For some applications it may be necessary to know the structure of the surface and the pores themselves. In most cases the etching process yields surfaces and pore geometries that are quite different from ideal planes and cylinders. In the presented work the production of different filter types will be described. The resulting surfaces and pore structures have been investigated by means of a scanning electron microscope. (author)

  8. Electron microscope autoradiography of isolated DNA molecules

    International Nuclear Information System (INIS)

    Delain, Etienne; Bouteille, Michel

    1980-01-01

    Autoradiographs of 3 H-thymidine-labelled DNA molecules were observed with an electron microscope. After ten months of exposure significant labelling was obtained with tritiated T7 DNA molecules which had a specific activity of 630,000 cpm/μg. Although isolated DNA molecules were not stretched out to such an extent that they could be rigorously compared to straight 'hot lines', the resolution was estimated and found to be similar to that obtained by autoradiography on thin plastic sections. The H.D. value was of the order of 1600A. From the known specific activity of the macromolecules, it was possible to compare the expected number of disintegrations from the samples to the number of grains obtained on the autoradiograms. This enabled us to calculate 1/ The absolute autoradiographic efficiency and 2/ The per cent ratio of thymidine residues labelled with tritium. These results throw some light on the resolution and sensitivity of electron microscope autoradiography of shadowed isolated macromolecules as compared to thin plastic sections

  9. General survey of recent development of photoemission spectroscopy

    International Nuclear Information System (INIS)

    Edamoto, Kazuyuki

    1994-01-01

    On the present state of the recent development of photoemission spectroscopy, by limiting the topics to the development of the spectroscopy proper and the development contributing to the progress of surface science, general explanation is made. As to the development that enabled to heighten spectrum resolution, surface core-level shift and the precise measurement of the Fermi surface of surface level are described, showing the example. Also a number of the developments which enabled the utilization of the light source, of which the wavelength is variable, and which was brought about by synchrotron radiation beam, were mentioned. Besides, spin polarized photoelectron spectroscopy, the development of photoelectron microscope and others are outlined. Photoemission spectroscopy is very useful for analyzing the electron condition of solid surfaces. There are two factors in heightening core level spectrum resolution, namely, heightening the resolution of an electron energy analyzer proper and the utilization of synchrotron radiation as a light source. High resolution core-level spectra, angle-resolved photoemission spectroscopy, and as the light source of which the wavelength is variable, resonance photoemission spectroscopy, constant initial state spectroscopy and soft X-ray photoemission spectroscopy, and as the recently developed spectroscopy, spin polarized photoemission spectroscopy, Auger photoelectron coincidence spectroscopy and photoelectron microscope are explained. (K.I.)

  10. Cathodoluminescence in the scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kociak, M., E-mail: mathieu.kociak@u-psud.fr [Laboratoire de Physique des Solides, Université Paris-SudParis-Sud, CNRS-UMR 8502, Orsay 91405 (France); Zagonel, L.F. [“Gleb Wataghin” Institute of Physics University of Campinas - UNICAMP, 13083-859 Campinas, São Paulo (Brazil)

    2017-05-15

    Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning transmission electron microscopy (STEM) has demonstrated great success in unveiling new physics in the field of plasmonics and quantum emitters. Most of these results were not imaginable even twenty years ago, due to conceptual and technical limitations. The purpose of this review is to present the recent advances that broke these limitations, and the new possibilities offered by the modern STEM-CL technique. We first introduce the different STEM-CL operating modes and the technical specificities in STEM-CL instrumentation. Two main classes of optical excitations, namely the coherent one (typically plasmons) and the incoherent one (typically light emission from quantum emitters) are investigated with STEM-CL. For these two main classes, we describe both the physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments. We then compare STEM-CL with its better known sister techniques: scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy. We finish by comprehensively reviewing recent STEM-CL applications. - Highlights: • Reviews the field of STEM-CL. • Introduces the technical requirements and challenges for STEM-CL. • Introduces the different types of excitations probed by STEM-CL. • Gives comprehensive overview of the last fifteenth years in the field.

  11. Electronic properties of novel topological quantum materials studied by angle-resolved photoemission spectroscopy (ARPES)

    Energy Technology Data Exchange (ETDEWEB)

    Wu, Yun [Iowa State Univ., Ames, IA (United States)

    2016-12-17

    The discovery of quantum Hall e ect has motivated the use of topology instead of broken symmetry to classify the states of matter. Quantum spin Hall e ect has been proposed to have a separation of spin currents as an analogue of the charge currents separation in quantum Hall e ect, leading us to the era of topological insulators. Three-dimensional analogue of the Dirac state in graphene has brought us the three-dimensional Dirac states. Materials with three-dimensional Dirac states could potentially be the parent compounds for Weyl semimetals and topological insulators when time-reversal or space inversion symmetry is broken. In addition to the single Dirac point linking the two dispersion cones in the Dirac/Weyl semimetals, Dirac points can form a line in the momentum space, resulting in a topological node line semimetal. These fascinating novel topological quantum materials could provide us platforms for studying the relativistic physics in condensed matter systems and potentially lead to design of new electronic devices that run faster and consume less power than traditional, silicon based transistors. In this thesis, we present the electronic properties of novel topological quantum materials studied by angle-resolved photoemission spectroscopy (ARPES).

  12. Method to map one-dimensional electronic wave function by using multiple Brillouin zone angle resolved photoemission

    Directory of Open Access Journals (Sweden)

    Dong-Wook Lee

    2010-10-01

    Full Text Available Angle resolved photoemission spectroscopy (ARPES is a powerful tool to investigate electronic structures in solids and has been widely used in studying various materials. The electronic structure information by ARPES is obtained in the momentum space. However, in the case of one-dimensional system, we here show that we extract the real space information from ARPES data taken over multiple Brillouin zones (BZs. Intensities in the multiple BZs are proportional to the photoemission matrix element which contains information on the coefficient of the Bloch wave function. It is shown that the Bloch wave function coefficients can be extracted from ARPES data, which allows us to construct the real space wave function. As a test, we use ARPES data from proto-typical one-dimensional system SrCuO2 and construct the real space wave function.

  13. Helium leak testing of scanning electron microscope

    International Nuclear Information System (INIS)

    Ahmad, Anis; Tripathi, S.K.; Mukherjee, D.

    2015-01-01

    Scanning Electron Microscope (SEM) is a specialized electron-optical device which is used for imaging of miniscule features on topography of material specimens. Conventional SEMs used finely focused high energy (about 30 KeV) electron beam probes of diameter of about 10nm for imaging of solid conducting specimens. Vacuum of the order of 10"-"5 Torr is prerequisite for conventional Tungsten filament type SEMs. One such SEM was received from one of our laboratory in BARC with a major leak owing to persisting poor vacuum condition despite continuous pumping for several hours. He-Leak Detection of the SEM was carried out at AFD using vacuum spray Technique and various potential leak joints numbering more than fifty were helium leak tested. The major leak was detected in the TMP damper bellow. The part was later replaced and the repeat helium leak testing of the system was carried out using vacuum spray technique. The vacuum in SEM is achieved is better than 10"-"5 torr and system is now working satisfactorily. (author)

  14. Photoemission and electron-stimulated desorption studies of H on W(110): Single- versus two-binding-site models

    International Nuclear Information System (INIS)

    Weng, S.

    1982-01-01

    The chemisorption of H on W(110) at room temperature is studied with the use of angle-integrated photoemission and electron-stimulated desorption (ESD). The ESD cross sections of H + are found to be sol low that no significant H + signals with meaningful ion energy distributions are observed. The photoemission results show, however, two types of H adatoms, referred to as β 2 and β 1 states, for this chemisorptive system. Both states are found to appear simultaneously rather than sequentially as suggested by previous studies, and exhibit a simple 1-theta adsorption kinetics with different initial sticking coefficients. The β 2 state induces two binding energy levels at -2.0 and -6.0 eV, respectively, whereas the β 1 state induces a level at -3.8 eV. The work-function change (with a maximum value of -0.45 eV) is found to follow exactly with the intensity of the β 2 state. These results are found to be compatible with the two-binding-site model, inherently suggested by the reflection high-enery electron-diffraction data. However, the results can also be consistent with a single-binding-site model suggested by a recent angle-resolved photoemission and inelastic electron scattering study. A model based on the present results is proposed and critically compared with previous studies. Unresolved problems associated with both single- and two-binding-site models are also discussed

  15. High voltage performance of a dc photoemission electron gun with centrifugal barrel-polished electrodes

    Science.gov (United States)

    Hernandez-Garcia, C.; Bullard, D.; Hannon, F.; Wang, Y.; Poelker, M.

    2017-09-01

    The design and fabrication of electrodes for direct current (dc) high voltage photoemission electron guns can significantly influence their performance, most notably in terms of maximum achievable bias voltage. Proper electrostatic design of the triple-point junction shield electrode minimizes the risk of electrical breakdown (arcing) along the insulator-cable plug interface, while the electrode shape is designed to maintain work, we describe a centrifugal barrel-polishing technique commonly used for polishing the interior surface of superconducting radio frequency cavities but implemented here for the first time to polish electrodes for dc high voltage photoguns. The technique reduced polishing time from weeks to hours while providing surface roughness comparable to that obtained with diamond-paste polishing and with unprecedented consistency between different electrode samples. We present electrode design considerations and high voltage conditioning results to 360 kV (˜11 MV/m), comparing barrel-polished electrode performance to that of diamond-paste polished electrodes. Tests were performed using a dc high voltage photogun with an inverted-geometry ceramic insulator design.

  16. Transition from the adiabatic to the sudden limit in core-electron photoemission

    Science.gov (United States)

    Hedin, Lars; Michiels, John; Inglesfield, John

    1998-12-01

    Experimental results for core-electron photoemission Jk(ω) are often compared with the one-electron spectral function Ac(ɛk-ω), where ω is the photon energy, ɛk is the photoelectron energy, and the optical transition matrix elements are taken as constant. Since Jk(ω) is nonzero only for ɛk>0, we must actually compare it with Ac(ɛk-ω)θ(ɛk). For metals Ac(ω) is known to have a quasiparticle (QP) peak with an asymmetric power-law [theories of Mahan, Nozières, de Dominicis, Langreth, and others (MND)] singularity due to low-energy particle-hole excitations. The QP peak starts at the core-electron energy ɛc, and is followed by an extended satellite (shakeup) structure at smaller ω. For photon energies ω just above threshold, ωth=-ɛc, Ac(ɛk-ω)θ(ɛk) as a function of ɛk (ω constant) is cut just behind the quasiparticle peak, and neither the tail of the MND line nor the plasmon satellites are present. The sudden (high-energy) limit is given by a convolution of Ac(ω) and a loss function, i.e., by the Berglund-Spicer two-step expression. Thus Ac(ω) alone does not give the correct photoelectron spectrum, neither at low nor at high energies. We present an extension of the quantum-mechanical (QM) models developed earlier by Inglesfield, and by Bardyszewski and Hedin to calculate Jk(ω). It includes recoil and damping, as well as shakeup effects and extrinsic losses, is exact in the high-energy limit, and allows calculations of Jk(ω) including the MND line and multiple plasmon losses. The model, which involves electrons coupled to quasibosons, is motivated by detailed arguments. As an illustration we have made quantitative calculations for a semi-infinite jellium with the density of aluminum metal and an embedded atom. The coupling functions (fluctuation potentials) between the electron and the quasibosons are related to the random-phase-approximation dielectric function, and different levels of approximations are evaluated numerically. The differences

  17. Comparative study of image contrast in scanning electron microscope and helium ion microscope.

    Science.gov (United States)

    O'Connell, R; Chen, Y; Zhang, H; Zhou, Y; Fox, D; Maguire, P; Wang, J J; Rodenburg, C

    2017-12-01

    Images of Ga + -implanted amorphous silicon layers in a 110 n-type silicon substrate have been collected by a range of detectors in a scanning electron microscope and a helium ion microscope. The effects of the implantation dose and imaging parameters (beam energy, dwell time, etc.) on the image contrast were investigated. We demonstrate a similar relationship for both the helium ion microscope Everhart-Thornley and scanning electron microscope Inlens detectors between the contrast of the images and the Ga + density and imaging parameters. These results also show that dynamic charging effects have a significant impact on the quantification of the helium ion microscope and scanning electron microscope contrast. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

  18. Electronic structure studies of ferro-pnictide superconductors and their parent compounds using angle-resolved photoemission spectroscopy (ARPES)

    International Nuclear Information System (INIS)

    Setti, Thirupathaiah

    2011-01-01

    The discovery of high temperature superconductivity in the iron pnictide compound LaO 1-x F x FeAs with T c = 26 K as created enormous interest in the high-T c superconductor community. So far, four prototypes of crystal structures have been found in the Fe-pnictide family. All four show a structural deformation followed or accompanied by a magnetic transition from a high temperature paramagnetic conductor to a low temperature antiferromagnetic metal whose transition temperature T N varies between the compounds. Charge carrier doping, isovalent substitution of the As atoms or the application of pressure suppresses the antiferromagnetic spin density wave (SDW) order and leads to a superconducting phase. More recently high Tc superconductivity has been also detected in iron chalchogenides with similar normal state properties. Since superconductivity is instability of the normal state, the study of normal state electronic structure in comparison with superconducting state could reveal important information on the pairing mechanism. Therefore, it is most important to study the electronic structure of these new superconductors, i.e., to determine Fermi surfaces and band dispersions near the Fermi level at the high symmetry points in order to obtain a microscopic understanding of the superconducting properties. Using the technique angle-resolved photoemission spectroscopy (ARPES) one measures the electrons ejected from a sample when photons impinge on it. In this way one can map the Fermi surface which provides useful information regarding the physics behind the Fermi surface topology of high T c superconductors. Furthermore, this technique provides information on the band dispersion, the orbital character of the bands, the effective mass, the coupling to bosonic excitations, and the superconducting gap. This emphasizes the importance of studying the electronic structure of the newly discovered Fe-pnictides using ARPES. In this work we have studied the electronic

  19. Electronic structure studies of ferro-pnictide superconductors and their parent compounds using angle-resolved photoemission spectroscopy (ARPES)

    Energy Technology Data Exchange (ETDEWEB)

    Setti, Thirupathaiah

    2011-07-14

    The discovery of high temperature superconductivity in the iron pnictide compound LaO{sub 1-x}F{sub x}FeAs with T{sub c} = 26 K as created enormous interest in the high-T{sub c} superconductor community. So far, four prototypes of crystal structures have been found in the Fe-pnictide family. All four show a structural deformation followed or accompanied by a magnetic transition from a high temperature paramagnetic conductor to a low temperature antiferromagnetic metal whose transition temperature T{sub N} varies between the compounds. Charge carrier doping, isovalent substitution of the As atoms or the application of pressure suppresses the antiferromagnetic spin density wave (SDW) order and leads to a superconducting phase. More recently high Tc superconductivity has been also detected in iron chalchogenides with similar normal state properties. Since superconductivity is instability of the normal state, the study of normal state electronic structure in comparison with superconducting state could reveal important information on the pairing mechanism. Therefore, it is most important to study the electronic structure of these new superconductors, i.e., to determine Fermi surfaces and band dispersions near the Fermi level at the high symmetry points in order to obtain a microscopic understanding of the superconducting properties. Using the technique angle-resolved photoemission spectroscopy (ARPES) one measures the electrons ejected from a sample when photons impinge on it. In this way one can map the Fermi surface which provides useful information regarding the physics behind the Fermi surface topology of high T{sub c} superconductors. Furthermore, this technique provides information on the band dispersion, the orbital character of the bands, the effective mass, the coupling to bosonic excitations, and the superconducting gap. This emphasizes the importance of studying the electronic structure of the newly discovered Fe-pnictides using ARPES. In this work we have

  20. Nitrogen implantation with a scanning electron microscope.

    Science.gov (United States)

    Becker, S; Raatz, N; Jankuhn, St; John, R; Meijer, J

    2018-01-08

    Established techniques for ion implantation rely on technically advanced and costly machines like particle accelerators that only few research groups possess. We report here about a new and surprisingly simple ion implantation method that is based upon a widespread laboratory instrument: The scanning electron microscope. We show that it can be utilized to ionize atoms and molecules from the restgas by collisions with electrons of the beam and subsequently accelerate and implant them into an insulating sample by the effect of a potential building up at the sample surface. Our method is demonstrated by the implantation of nitrogen ions into diamond and their subsequent conversion to nitrogen vacancy centres which can be easily measured by fluorescence confocal microscopy. To provide evidence that the observed centres are truly generated in the way we describe, we supplied a 98% isotopically enriched 15 N gas to the chamber, whose natural abundance is very low. By employing the method of optically detected magnetic resonance, we were thus able to verify that the investigated centres are actually created from the 15 N isotopes. We also show that this method is compatible with lithography techniques using e-beam resist, as demonstrated by the implantation of lines using PMMA.

  1. Electronic structure of C r2AlC as observed by angle-resolved photoemission spectroscopy

    Science.gov (United States)

    Ito, Takahiro; Pinek, Damir; Fujita, Taishi; Nakatake, Masashi; Ideta, Shin-ichiro; Tanaka, Kiyohisa; Ouisse, Thierry

    2017-11-01

    We investigate the electronic band structure and Fermi surfaces (FSs) of C r2AlC single crystals with angle-resolved photoemission spectroscopy. We evidence hole bands centered around the M points and electron bands centered around the Γ point in reciprocal space. Electron and hole bands exhibit an open, tubular structure along the c axis, confirming the quasi-two-dimensional character of this highly anisotropic, nanolamellar compound. Dependence of the photoionization cross sections on beam light polarization and orientation allows us to assess the orbital character of each observed band locally. Despite some differences, density functional theory calculations show a good agreement with experiment.

  2. Time-resolved photoemission spectroscopy of electronic cooling and localization in CH3NH3PbI3 crystals

    Science.gov (United States)

    Chen, Zhesheng; Lee, Min-i.; Zhang, Zailan; Diab, Hiba; Garrot, Damien; Lédée, Ferdinand; Fertey, Pierre; Papalazarou, Evangelos; Marsi, Marino; Ponseca, Carlito; Deleporte, Emmanuelle; Tejeda, Antonio; Perfetti, Luca

    2017-09-01

    We measure the surface of CH3NH3PbI3 single crystals by making use of two-photon photoemission spectroscopy. Our method monitors the electronic distribution of photoexcited electrons, explicitly discriminating the initial thermalization from slower dynamical processes. The reported results disclose the fast-dissipation channels of hot carriers (0.25 ps), set an upper bound to the surface-induced recombination velocity (PbI3 samples is consistent with the progressive reduction of photoconversion efficiency in operating devices. Minimizing the density of shallow traps and solving the aging problem may boost the macroscopic efficiency of solar cells to the theoretical limit.

  3. A sub-cm micromachined electron microscope

    Science.gov (United States)

    Feinerman, A. D.; Crewe, D. A.; Perng, D. C.; Shoaf, S. E.; Crewe, A. V.

    1993-01-01

    A new approach for fabricating macroscopic (approximately 10x10x10 mm(exp 3)) structures with micron accuracy has been developed. This approach combines the precision of semiconductor processing and fiber optic technologies. A (100) silicon wafer is anisotropically etched to create four orthogonal v-grooves and an aperture on each 10x12 mm die. Precision 308 micron optical fibers are sandwiched between the die to align the v-grooves. The fiber is then anodically bonded to the die above and below it. This procedure is repeated to create thick structures and a stack of 5 or 6 die will be used to create a miniature scanning electron microscope (MSEM). Two die in the structure will have a segmented electrode to deflect the beam and correct for astigmatism. The entire structure is UHV compatible. The performance of an SEM improves as its length is reduced and a sub-cm 2 keV MSEM with a field emission source should have approximately 1 nm resolution. A low voltage high resolution MSEM would be useful for the examination of biological specimens and semiconductors with a minimum of damage. The first MSEM will be tested with existing 6 micron thermionic sources. In the future a micromachined field emission source will be used. The stacking technology presented in this paper can produce an array of MSEMs 1 to 30 mm in length with a 1 mm or larger period. A key question being addressed by this research is the optimum size for a low voltage MSEM which will be determined by the required spatial resolution, field of view, and working distance.

  4. The trajectories of secondary electrons in the scanning electron microscope.

    Science.gov (United States)

    Konvalina, Ivo; Müllerová, Ilona

    2006-01-01

    Three-dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart-Thornley detector of SE and to reveal fundamental rules for tailoring the set-ups in which efficient signal acquisition can be expected. Intuitive realizations about the easiness of attracting the SEs towards the biased front grid of the detector have shown themselves likely as false, and all grounded objects in the chamber have been proven to influence the spatial distribution of the signal-extracting field. The role of the magnetic field penetrating from inside the objective lens is shown to play an ambiguous role regarding possible support for the signal collection.

  5. Hot Electron Photoemission from Plasmonic Nanoparticles: Role of Transient Absorption in Surface Mechanism

    DEFF Research Database (Denmark)

    Uskov, Alexander V.; Protsenko, Igor E.; Ikhsanov, Renat S.

    2014-01-01

    We analyze and compare surface- and vol ume-based internal photoelectric effects from spherical nanoparticles, obtaining analytical expression s for the photoemission rate in both cases. Similar to results for a flat metal surface, one can show that the surface mechanism preva ils, since it is un...

  6. Attosecond-controlled photoemission from metal nanowire tips in the few-electron regime

    KAUST Repository

    Ahn, B.; Schö tz, J.; Kang, M.; Okell, W. A.; Mitra, S.; Fö rg, B.; Zherebtsov, S.; Sü ß mann, F.; Burger, C.; Kü bel, M.; Liu, C.; Wirth, A.; Di Fabrizio, Enzo M.; Yanagisawa, H.; Kim, D.; Kim, B.; Kling, M. F.

    2017-01-01

    sources for microscopy. Here, we report the generation of high energy photoelectrons (up to 160 eV) in photoemission from single-crystalline nanowire tips in few-cycle, 750-nm laser fields at peak intensities of (2-7.3) × 1012 W/cm2. Recording the carrier

  7. A new approach to nuclear microscopy: The ion-electron emission microscope

    International Nuclear Information System (INIS)

    Doyle, B.L.; Vizkelethy, G.; Walsh, D.S.; Senftinger, B.; Mellon, M.

    1998-01-01

    A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion

  8. Watching Electrons Transfer from Metals to Insulators using Two Photon Photoemission

    Energy Technology Data Exchange (ETDEWEB)

    Johns, James E. [Univ. of California, Berkeley, CA (United States)

    2010-05-01

    Ultrafast angle-resolved two photon photoemission was used to study the dynamics and interfacial band structure of ultrathin films adsorbed onto Ag(111). Studies focused on the image potential state (IPS) in each system as a probe for measuring changes in electronic behavior in differing environments. The energetics and dynamics of the IPS at the toluene/Ag(111) interface are strongly dependent upon coverage. For a single monolayer, the first IPS is bound by 0.81 eV below the vacuum level and has a lifetime of 50 femtoseconds (fs). Further adsorption of toluene creates islands of toluene with an exposed wetting layer underneath. The IPS is then split into two peaks, one corresponding to the islands and one corresponding to the monolayer. The wetting layer IPS shows the same dynamics as the monolayer, while the lifetime of the islands increases exponentially with increasing thickness. Furthermore, the island IPS transitions from delocalized to localized within 500 fs, and electrons with larger parallel momenta decay much faster. Attempts were made using a stochastic model to extract the rates of localization and intraband cooling at differing momenta. In sexithiophene (6T) and dihexyl-sexithiophene (DH6T), the IPS was used as a probe to see if the nuclear motion of spectating side chains can interfere with molecular conduction. The energy and band mass of the IPS was measured for 6T and two geometries of DH6T on Ag(111). Electrons injected into the thicker coverages of DH6T grew exponentially heavier until they were completely localized by 230 fs, while those injected into 6T remained nearly free electron like. Based off of lifetime arguments and the density of defects, the most likely cause for the mass enhancement of the IPS in this system is small polaron formation caused by coupling of the electron to vibrations of the alkyl substituents. The energetic relaxation of the molecular adsorbate was also measured to be 20 meV/100 fs for the DH6T, and 0 meV/100 fs for

  9. Ga droplet morphology on GaAs(001) studied by Lloyd's mirror photoemission electron microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Tang, W X; Jesson, D E; Pavlov, K M; Morgan, M J [School of Physics, Monash University, Victoria 3800 (Australia); Usher, B F [Department of Electronic Engineering, La Trobe University, Victoria 3086 (Australia)

    2009-08-05

    We apply Lloyd's mirror photoemission electron microscopy (PEEM) to study the surface shape of Ga droplets on GaAs(001). An unusual rectangular-based droplet shape is identified and the contact angle is determined in situ. It is shown that quenching does not appreciably affect droplet shape and ex situ measurements of the contact angle by atomic force microscopy are in good agreement with Lloyd's mirror PEEM. Extension of Lloyd's mirror technique to reconstruct general three-dimensional (3D) surface shapes and the potential use of synchrotron radiation to improve vertical resolution is discussed.

  10. Photoemission study of electronic structure of the half-metallic ferromagnet Co3Sn2S2

    Science.gov (United States)

    Holder, M.; Dedkov, Yu. S.; Kade, A.; Rosner, H.; Schnelle, W.; Leithe-Jasper, A.; Weihrich, R.; Molodtsov, S. L.

    2009-05-01

    Surface electronic structure of polycrystalline and single-crystalline samples of the half-metallic ferromagnet Co3Sn2S2 was studied by means of angle-resolved and core-level photoemissions. The experiments were performed in temperature regimes both above and below a Curie temperature of 176.9 K. The spectroscopic results are compared to local-spin density approximation band-structure calculations for the bulk samples. It is found that the surface sensitive experimental data are generally reproduced by the bulk computation suggesting that the theoretically predicted half-metallic properties of Co3Sn2S2 are retained at the surface.

  11. Study of Si-N amorphous compounds combining XPS (X photoemission) and EELS (electron energy loss spectra) optical measurements. Internal levels photoemission. Pt. 2

    International Nuclear Information System (INIS)

    Guraya, M.M.; Acolani, H.; Zampieri, G.E.; Silva, J.H. Dias da; Cisneros, J.I.; Cantao, M.; Marques, F.C.

    1990-01-01

    A Si-N non-stoichiometric hydrogenated amorphous compounds study with different N- contents is presented. The shape and shifts of the photoemission peaks corresponding to the N - 1s and Si - 2p internal levels are analyzed. Based on the latter, the homogeneity of the samples and the Si - N bonds charge transfer is discussed. (Author) [es

  12. An electron microscope for the aberration-corrected era

    Energy Technology Data Exchange (ETDEWEB)

    Krivanek, O.L. [Nion Co., 1102 8th Street, Kirkland, WA 98033 (United States)], E-mail: krivanek.ondrej@gmail.com; Corbin, G.J.; Dellby, N.; Elston, B.F.; Keyse, R.J.; Murfitt, M.F.; Own, C.S.; Szilagyi, Z.S.; Woodruff, J.W. [Nion Co., 1102 8th Street, Kirkland, WA 98033 (United States)

    2008-02-15

    Improved resolution made possible by aberration correction has greatly increased the demands on the performance of all parts of high-end electron microscopes. In order to meet these demands, we have designed and built an entirely new scanning transmission electron microscope (STEM). The microscope includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors. The microscope features many innovations, such as a modular column assembled from building blocks that can be stacked in almost any order, in situ storage and cleaning facilities for up to five samples, computer-controlled loading of samples into the column, and self-diagnosing electronics. The microscope construction is described, and examples of its capabilities are shown.

  13. An electron microscope for the aberration-corrected era

    International Nuclear Information System (INIS)

    Krivanek, O.L.; Corbin, G.J.; Dellby, N.; Elston, B.F.; Keyse, R.J.; Murfitt, M.F.; Own, C.S.; Szilagyi, Z.S.; Woodruff, J.W.

    2008-01-01

    Improved resolution made possible by aberration correction has greatly increased the demands on the performance of all parts of high-end electron microscopes. In order to meet these demands, we have designed and built an entirely new scanning transmission electron microscope (STEM). The microscope includes a flexible illumination system that allows the properties of its probe to be changed on-the-fly, a third-generation aberration corrector which corrects all geometric aberrations up to fifth order, an ultra-responsive yet stable five-axis sample stage, and a flexible configuration of optimized detectors. The microscope features many innovations, such as a modular column assembled from building blocks that can be stacked in almost any order, in situ storage and cleaning facilities for up to five samples, computer-controlled loading of samples into the column, and self-diagnosing electronics. The microscope construction is described, and examples of its capabilities are shown

  14. Electron optical characteristics of a concave electrostatic electron mirror for a scanning electron microscope

    International Nuclear Information System (INIS)

    Hamarat, R.T.; Witzani, J.; Hoerl, E.M.

    1984-08-01

    Numerical computer calculations are used to explore the design characteristics of a concave electrostatic electron mirror for a mirror attachment for a conventional scanning electron microscope or an instrument designed totally as a scanning electron mirror microscope. The electron paths of a number of set-ups are calculated and drawn graphically in order to find the optimum shape and dimensions of the mirror geometry. This optimum configuration turns out to be the transition configuration between two cases of electron path deflection, towards the optical axis of the system and away from it. (Author)

  15. Relativistic acceleration and retardation effects on photoemission of intense electron short pulses, in RF-FEL photoinjectors

    International Nuclear Information System (INIS)

    Dolique, J.M.; Coacolo, M.

    1991-01-01

    In high-power free electron lasers, self-field effects in the electron beam are often the most important phenomenon on which the beam quality depends. These effects are generally conceived as space-charge effects, and described by a Poisson equation in a beam frame. In RF-FEL photoinjectors, the electrons of the intense short pulse produced by laser irradiation are submitted, just after their photoemission, to such a strong acceleration that relativistic acceleration and retardation effects are discussed, from the rigorous calculation of the Lienard-Wiechert velocity- and acceleration electric and magnetic fields, as a function of RF-electric field and beam parameters. The beam pulse is assumed to be axisymmetric, with a constant photoemitted current density. Consequences for the maximum current density that can be extracted are considered (the 'self-field limit,' a name more appropriate than 'space-charge limit' for the present conditions where electro-dynamic phenomena play an important role)

  16. Electronic structure of the Ga1-xCr xN studied by high-energy photoemission spectroscopy

    International Nuclear Information System (INIS)

    Kim, J.J.; Makino, H.; Yao, T.; Takata, Y.; Kobayashi, K.; Yamamoto, T.; Hanada, T.; Cho, M.W.; Ikenaga, E.; Yabashi, M.; Miwa, D.; Nishino, Y.; Tamasaku, K.; Ishikawa, T.; Shin, S.

    2005-01-01

    Valence band spectra of Ga 1-x Cr x N have been investigated by high-energy photoemission spectroscopy at the photon energy of 5.95 keV. Cr doping does introduce a novel electronic structure in the bandgap and causes some change in valence band structure. Based on the first-principle calculation, Cr-associated electronic levels in the bandgap are assigned to nonbonding and antibonding d states while the change of the valence band suggests that the Ga 4s originated states are significantly modified through hybridization with the Cr 3d orbital. The present result evidences that the Ga valence electrons are considerably modified through the interaction with the second nearest-neighbour Cr atoms

  17. Unoccupied electronic state of delafossite-type PdCoO2 single crystal probed using inverse photoemission spectroscopy

    International Nuclear Information System (INIS)

    Higuchi, Tohru; Tsukamoto, Takeyo; Hasegawa, Masashi; Tanaka, Masayuki; Takei, Humihiko; Shin, Shik

    2004-01-01

    The unoccupied electronic state of delafossite-type PdCoO 2 has been studied using inverse-photoemission spectroscopy (IPES). The Fermi edge and the unoccupied density-of-state (DOS) at the Fermi level (E F ) are not observed in the IPES spectrum measured at the incidence electron energy (E K ) of 100 eV, which corresponds to the Cooper minimum of Pd 4d. The finite DOS at E F is observed in the IPES spectra measured at the lower E K , which the ionization cross section of Pd 4d increases. These findings indicate that the Pd 4d electron is closely related to the low electrical resistivity of PdCoO 2 . (author)

  18. Microscopic origin of the mobility enhancement at a spinel/perovskite oxide heterointerface revealed by photoemission spectroscopy

    DEFF Research Database (Denmark)

    Schuetz, P.; Christensen, Dennis Valbjørn; Borisov, V.

    2017-01-01

    The spinel/perovskite heterointerface γ−Al2O3/SrTiO3 hosts a two-dimensional electron system (2DES) with electron mobilities exceeding those in its all-perovskite counterpart LaAlO3/SrTiO3 by more than an order of magnitude, despite the abundance of oxygen vacancies which act as electron donors a...

  19. Imaging differential polarization microscope with electronic readout

    International Nuclear Information System (INIS)

    Mickols, W.; Tinoco, I.; Katz, J.E.; Maestre, M.F.; Bustamante, C.

    1985-01-01

    A differential polarization microscope forms two images: one of the transmitted intensity and the other due to the change in intensity between images formed when different polarizations of light are used. The interpretation of these images for linear dichroism and circular dichroism are described. The design constraints on the data acquisition systems and the polarization modulation are described. The advantage of imaging several biological systems which contain optically anisotropic structures are described

  20. Quantitative methods for the analysis of electron microscope images

    DEFF Research Database (Denmark)

    Skands, Peter Ulrik Vallø

    1996-01-01

    The topic of this thesis is an general introduction to quantitative methods for the analysis of digital microscope images. The images presented are primarily been acquired from Scanning Electron Microscopes (SEM) and interfermeter microscopes (IFM). The topic is approached though several examples...... foundation of the thesis fall in the areas of: 1) Mathematical Morphology; 2) Distance transforms and applications; and 3) Fractal geometry. Image analysis opens in general the possibility of a quantitative and statistical well founded measurement of digital microscope images. Herein lies also the conditions...

  1. Scanning electron microscopic evaluation of root canal surfaces ...

    African Journals Online (AJOL)

    Scanning electron microscopic evaluation of root canal surfaces prepared with three rotary endodontic systems: Lightspeed, ProTaper and EndoWave. ... fracture with LightSpeed (LS), ProTaper (PT) and EndoWave (Ew) rotary instruments.

  2. Influence of cathode geometry on electron dynamics in an ultrafast electron microscope

    Directory of Open Access Journals (Sweden)

    Shaozheng Ji

    2017-09-01

    Full Text Available Efforts to understand matter at ever-increasing spatial and temporal resolutions have led to the development of instruments such as the ultrafast transmission electron microscope (UEM that can capture transient processes with combined nanometer and picosecond resolutions. However, analysis by UEM is often associated with extended acquisition times, mainly due to the limitations of the electron gun. Improvements are hampered by tradeoffs in realizing combinations of the conflicting objectives for source size, emittance, and energy and temporal dispersion. Fundamentally, the performance of the gun is a function of the cathode material, the gun and cathode geometry, and the local fields. Especially shank emission from a truncated tip cathode results in severe broadening effects and therefore such electrons must be filtered by applying a Wehnelt bias. Here we study the influence of the cathode geometry and the Wehnelt bias on the performance of a photoelectron gun in a thermionic configuration. We combine experimental analysis with finite element simulations tracing the paths of individual photoelectrons in the relevant 3D geometry. Specifically, we compare the performance of guard ring cathodes with no shank emission to conventional truncated tip geometries. We find that a guard ring cathode allows operation at minimum Wehnelt bias and improve the temporal resolution under realistic operation conditions in an UEM. At low bias, the Wehnelt exhibits stronger focus for guard ring than truncated tip cathodes. The increase in temporal spread with bias is mainly a result from a decrease in the accelerating field near the cathode surface. Furthermore, simulations reveal that the temporal dispersion is also influenced by the intrinsic angular distribution in the photoemission process and the initial energy spread. However, a smaller emission spot on the cathode is not a dominant driver for enhancing time resolution. Space charge induced temporal broadening

  3. Influence of cathode geometry on electron dynamics in an ultrafast electron microscope.

    Science.gov (United States)

    Ji, Shaozheng; Piazza, Luca; Cao, Gaolong; Park, Sang Tae; Reed, Bryan W; Masiel, Daniel J; Weissenrieder, Jonas

    2017-09-01

    Efforts to understand matter at ever-increasing spatial and temporal resolutions have led to the development of instruments such as the ultrafast transmission electron microscope (UEM) that can capture transient processes with combined nanometer and picosecond resolutions. However, analysis by UEM is often associated with extended acquisition times, mainly due to the limitations of the electron gun. Improvements are hampered by tradeoffs in realizing combinations of the conflicting objectives for source size, emittance, and energy and temporal dispersion. Fundamentally, the performance of the gun is a function of the cathode material, the gun and cathode geometry, and the local fields. Especially shank emission from a truncated tip cathode results in severe broadening effects and therefore such electrons must be filtered by applying a Wehnelt bias. Here we study the influence of the cathode geometry and the Wehnelt bias on the performance of a photoelectron gun in a thermionic configuration. We combine experimental analysis with finite element simulations tracing the paths of individual photoelectrons in the relevant 3D geometry. Specifically, we compare the performance of guard ring cathodes with no shank emission to conventional truncated tip geometries. We find that a guard ring cathode allows operation at minimum Wehnelt bias and improve the temporal resolution under realistic operation conditions in an UEM. At low bias, the Wehnelt exhibits stronger focus for guard ring than truncated tip cathodes. The increase in temporal spread with bias is mainly a result from a decrease in the accelerating field near the cathode surface. Furthermore, simulations reveal that the temporal dispersion is also influenced by the intrinsic angular distribution in the photoemission process and the initial energy spread. However, a smaller emission spot on the cathode is not a dominant driver for enhancing time resolution. Space charge induced temporal broadening shows a close to

  4. Development of superconducting cryo-electron microscope and its applications

    International Nuclear Information System (INIS)

    Iwatsuki, Masashi

    1988-01-01

    Recently, a superconducting cryo-electron microscope in which specimens are cooled to the liquid helium temperature (4.2 K) has been developed. The main components and functional features of this new microscope are reported together with application data on polyethylene, poly (4-methyl-1-pentene), valonia cellulose, rock salt, ice crystallites and ceramic superconductor. The resistance to electron radiation damage, of beam-sensitive specimens including polymers has been increased more than ten times. Thus, the microscope has made it possible to take high resolution images and to analyze the crystal-structure of micro-areas. (orig.) [de

  5. Development of the Atomic-Resolution Environmental Transmission Electron Microscope

    DEFF Research Database (Denmark)

    Gai, Pratibha L.; Boyes, Edward D.; Yoshida, Kenta

    2016-01-01

    The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures is descr......The development of the novel atomic-resolution environmental transmission electron microscope (atomic-resolution ETEM) for directly probing dynamic gas–solid reactions in situ at the atomic level under controlled reaction conditions consisting of gas environment and elevated temperatures...... is used to study steels, graphene, nanowires, etc. In this chapter, the experimental setup of the microscope column and its peripherals are described....

  6. Simultaneous specimen and stage cleaning device for analytical electron microscope

    Science.gov (United States)

    Zaluzec, Nestor J.

    1996-01-01

    An improved method and apparatus are provided for cleaning both a specimen stage, a specimen and an interior of an analytical electron microscope (AEM). The apparatus for cleaning a specimen stage and specimen comprising a plasma chamber for containing a gas plasma and an air lock coupled to the plasma chamber for permitting passage of the specimen stage and specimen into the plasma chamber and maintaining an airtight chamber. The specimen stage and specimen are subjected to a reactive plasma gas that is either DC or RF excited. The apparatus can be mounted on the analytical electron microscope (AEM) for cleaning the interior of the microscope.

  7. Energy dispersive X-ray analysis in the electron microscope

    CERN Document Server

    Bell, DC

    2003-01-01

    This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical me

  8. Integration of a high-NA light microscope in a scanning electron microscope.

    Science.gov (United States)

    Zonnevylle, A C; Van Tol, R F C; Liv, N; Narvaez, A C; Effting, A P J; Kruit, P; Hoogenboom, J P

    2013-10-01

    We present an integrated light-electron microscope in which an inverted high-NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing high-resolution optical microscopy and scanning electron microscopy on the same area of a sample simultaneously. Components for light illumination and detection can be mounted outside the vacuum, enabling flexibility in the construction of the light microscope. The light objective lens can be positioned underneath the SEM objective lens during operation for sub-10 μm alignment of the fields of view of the light and electron microscopes. We demonstrate in situ epifluorescence microscopy in the SEM with a numerical aperture of 1.4 using vacuum-compatible immersion oil. For a 40-nm-diameter fluorescent polymer nanoparticle, an intensity profile with a FWHM of 380 nm is measured whereas the SEM performance is uncompromised. The integrated instrument may offer new possibilities for correlative light and electron microscopy in the life sciences as well as in physics and chemistry. © 2013 The Authors Journal of Microscopy © 2013 Royal Microscopical Society.

  9. Review of the theoretical description of time-resolved angle-resolved photoemission spectroscopy in electron-phonon mediated superconductors

    Energy Technology Data Exchange (ETDEWEB)

    Kemper, A.F. [Department of Physics, North Carolina State University, Raleigh, NC (United States); Sentef, M.A. [Max Planck Institute for the Structure and Dynamics of Matter, Center for Free Electron Laser Science, Hamburg (Germany); Moritz, B. [Stanford Institute for Materials and Energy Sciences (SIMES), SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Devereaux, T.P. [Stanford Institute for Materials and Energy Sciences (SIMES), SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Geballe Laboratory for Advanced Materials, Stanford University, Stanford, CA (United States); Freericks, J.K. [Department of Physics, Georgetown University, Washington, DC (United States)

    2017-09-15

    We review recent work on the theory for pump/probe photoemission spectroscopy of electron-phonon mediated superconductors in both the normal and the superconducting states. We describe the formal developments that allow one to solve the Migdal-Eliashberg theory in nonequilibrium for an ultrashort laser pumping field, and explore the solutions which illustrate the relaxation as energy is transferred from electrons to phonons. We focus on exact results emanating from sum rules and approximate numerical results which describe rules of thumb for relaxation processes. In addition, in the superconducting state, we describe how Anderson-Higgs oscillations can be excited due to the nonlinear coupling with the electric field and describe mechanisms where pumping the system enhances superconductivity. (copyright 2017 by WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  10. Fourier Transform Photoemission Spectroscopy

    NARCIS (Netherlands)

    Meinders, M.B.J.; Drabe, K.E.; Jonkman, H.T.; Sawatzky, G.A.

    1996-01-01

    It is shown that photoemission spectra can be obtained by exciting the electrons with two phase-correlated wave trains. The phase-correlated wave trains are obtained by sending broad-band ultra-violet light, coming from a deuterium lamp, through a Michelson interferometer. It is possible to

  11. Fourier transform photoemission spectroscopy

    NARCIS (Netherlands)

    Meinders, M.B J; Drabe, K.E.; Jonkman, H.T.; Sawatzky, G.A

    It is shown that photoemission spectra can be obtained by exciting the electrons with two phase-correlated wave trains. The phase-correlated wave trains are obtained by sending broad-band ultra-violet light, coming from a deuterium lamp, through a Michelson interferometer. It is possible to

  12. Bulk electronic state of high-Tc cuprate La2-xSrxCuO4 observed by high-energy angle integrated and resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Kasai, S.; Sekiyama, A.; Tsunekawa, M.; Ernst, P.T.; Shigemoto, A.; Yamasaki, A.; Irizawa, A.; Imada, S.; Sing, M.; Muro, T.; Sasagawa, T.; Takagi, H.; Suga, S.

    2005-01-01

    The high-energy core-level photoemission spectroscopy (PES) and angle-resolved photoemission spectroscopy (ARPES) measurements have been performed for La 2-x Sr x CuO 4 (LSCO). Polar-angle dependence of the Cu 2p core-level PES has revealed a discrepancy between bulk and surface. We have observed by the high-energy ARPES that the Fermi surface of LSCO with x=0.16 is electron-like, in contrast to previous low-energy ARPES results

  13. Electron microscope study of irradiated beryllium oxide

    International Nuclear Information System (INIS)

    Bisson, A.A.

    1965-06-01

    The beryllium oxide is studied first by fractography, before and after irradiation, using sintered samples. The fractures are examined under different aspects. The higher density sintered samples, with transgranular fractures are the most interesting for a microscopic study. It is possible to mark the difference between the 'pores' left by the sintering process and the 'bubbles' of gases that can be produced by former thermal treatments. After irradiation, the grain boundaries are very much weakened. By annealing, it is possible to observe the evolution of the gases produced by the reaction (n, 2n) and (n. α) and gathered on the grain boundaries. The irradiated beryllium oxide is afterwards studied by transmission. For that, a simple method has been used: little chips of the crushed material are examined. Clusters of point defects produced by neutrons are thus detected in crystals irradiated at the three following doses: 6 x 10 19 , 9 x 10 19 and 2 x 10 20 n f cm -2 at a temperature below 100 deg. C. For the irradiation at 6 x 10 19 n f cm -2 , the defects are merely visible, but at 2 x l0 20 n f cm -2 the crystals an crowded with clusters and the Kikuchi lines have disappeared from the micro-diffraction diagrams. The evolution of the clusters into dislocation loops is studied by a series of annealings. The activation energy (0,37 eV) calculated from the annealing curves suggests that it must be interstitials that condense into dislocation loops. Samples irradiated at high temperatures (650, 900 and 1100 deg. C) are also studied. In those specimens the size of the loops is not the same as the equilibrium size obtained after out of pile annealing at the same temperature. Those former loops are more specifically studied and their Burgers vector is determined by micro-diffraction. (author) [fr

  14. Electronic structure of heavy fermion system CePt2In7 from angle-resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Shen Bing; Yu Li; Lyu Shou-Peng; Jia Xiao-Wen; Zhang Yan; Wang Chen-Lu; Hu Cheng; Ding Ying; Sun Xuan; Hu Yong; Liu Jing; Gao Qiang; Zhao Lin; Liu Guo-Dong; Liu Kai; Lu Zhong-Yi; Bauer, E D; Thompson, J D; Xu Zu-Yan; Chen Chuang-Tian

    2017-01-01

    We have carried out high-resolution angle-resolved photoemission measurements on the Ce-based heavy fermion compound CePt 2 In 7 that exhibits stronger two-dimensional character than the prototypical heavy fermion system CeCoIn 5 . Multiple Fermi surface sheets and a complex band structure are clearly resolved. We have also performed detailed band structure calculations on CePt 2 In 7 . The good agreement found between our measurements and the calculations suggests that the band renormalization effect is rather weak in CePt 2 In 7 . A comparison of the common features of the electronic structure of CePt 2 In 7 and CeCoIn 5 indicates that CeCoIn 5 shows a much stronger band renormalization effect than CePt 2 In 7 . These results provide new information for understanding the heavy fermion behaviors and unconventional superconductivity in Ce-based heavy fermion systems. (paper)

  15. Chlorine-induced modifications in the electronic structure of Ag surfaces: a metastable deexcitation spectroscopy and photoemission comparative study

    CERN Document Server

    Pasquali, L; Canepa, M; Staicu-Casagrande, E M; Esaulov, V A

    2003-01-01

    Surface-sensitive spectroscopic techniques, namely metastable deexcitation spectroscopy (MDS) and ultraviolet photoemission (UPS), have been applied to investigate the effects of chlorine chemisorption on the electronic properties (surface density of states and charge density) of Ag(100), Ag(110) and Ag(111) surfaces. Initial stages of chemisorption, up to the formation of a saturated Cl overlayer, have been examined. In particular, MDS permitted us to observe at low Cl gas exposure a progressive depletion of the Ag (5s) charge due to transfer and bonding with Cl atoms. From both MDS and UPS it was possible to observe the development of Cl (3p) bonding and anti-bonding states, the amount of their splitting increasing with coverage. Differences between chemisorption at the three surfaces have been noticed and they have been justified in terms of the different adatom packing and possible formation of small AgCl clusters (especially for the Ag(111) surface).

  16. Chlorine-induced modifications in the electronic structure of Ag surfaces: a metastable deexcitation spectroscopy and photoemission comparative study

    International Nuclear Information System (INIS)

    Pasquali, L; Nannarone, S; Canepa, M; Staicu-Casagrande, E M; Esaulov, V A

    2003-01-01

    Surface-sensitive spectroscopic techniques, namely metastable deexcitation spectroscopy (MDS) and ultraviolet photoemission (UPS), have been applied to investigate the effects of chlorine chemisorption on the electronic properties (surface density of states and charge density) of Ag(100), Ag(110) and Ag(111) surfaces. Initial stages of chemisorption, up to the formation of a saturated Cl overlayer, have been examined. In particular, MDS permitted us to observe at low Cl gas exposure a progressive depletion of the Ag (5s) charge due to transfer and bonding with Cl atoms. From both MDS and UPS it was possible to observe the development of Cl (3p) bonding and anti-bonding states, the amount of their splitting increasing with coverage. Differences between chemisorption at the three surfaces have been noticed and they have been justified in terms of the different adatom packing and possible formation of small AgCl clusters (especially for the Ag(111) surface)

  17. Shielded scanning electron microscope for radioactive samples

    International Nuclear Information System (INIS)

    Crouse, R.S.; Parsley, W.B.

    1977-01-01

    A small commercial SEM had been successfully shielded for examining radioactive materials transferred directly from a remote handling facility. Relatively minor mechanical modifications were required to achieve excellent operation. Two inches of steel provide adequate shielding for most samples encountered. However, samples reading 75 rad/hr γ have been examined by adding extra shielding in the form of tungsten sample holders and external lead shadow shields. Some degradation of secondary electron imaging was seen but was adequately compensated for by changing operating conditions

  18. Electron-microscopic autoradiography of tritiated testosterone in rat testis

    International Nuclear Information System (INIS)

    Frederik, P.M.; Molen, H.J. van der; Galjaard, H.; Klepper, D.

    1977-01-01

    The feasibility of a technique for autoradiography of diffusible substances has been further tested by analysing the localization of steroids in rats testes with the light- and electron-microscope. Testes of rats were perfused with tritiated testosterone (3 min) followed by 15-min perfusion with buffer containing a 100-fold excess of unlabelled testosterone. Tissue samples were frozen, freeze dried, fixed in osmium vapour and embedded in Epon. To exclude extraction of steroids, contact with water and other solvents was prevented during cutting of thin sections on an ultracryotome and further treatment for autoradiography. Light- and electron-microscopic observations indicated that the highest concentration of labelled testosterone was present within the basal parts of the Sertoli cell cytoplasm and in lipid inclusions of Sertoli cells within the seminiferous tubules. This is the first account of autoradiography of steroids at the electron-microscope level. (author)

  19. Analytical electron microscope study of eight ataxites

    Science.gov (United States)

    Novotny, P. M.; Goldstein, J. I.; Williams, D. B.

    1982-01-01

    Optical and electron optical (SEM, TEM, AEM) techniques were employed to investigate the fine structure of eight ataxite-iron meteorites. Structural studies indicated that the ataxites can be divided into two groups: a Widmanstaetten decomposition group and a martensite decomposition group. The Widmanstaetten decomposition group has a Type I plessite microstructure and the central taenite regions contain highly dislocated lath martensite. The steep M shaped Ni gradients in the taenite are consistent with the fast cooling rates, of not less than 500 C/my, observed for this group. The martensite decomposition group has a Type III plessite microstructure and contains all the chemical group IVB ataxites. The maximum taenite Ni contents vary from 47.5 to 52.7 wt % and are consistent with slow cooling to low temperatures of not greater than 350 C at cooling rates of not greater than 25 C/my.

  20. Electron microscope study of Sarcocystis sp

    Science.gov (United States)

    Zeve, V.H.; Price, D.L.; Herman, C.M.

    1966-01-01

    Sarcocystis sp. obtained from wild populations of grackles, Quiscalus quiscula (Linn.), were examined to clarify the effect of the parasite on the host. Electron micrographs are presented to show areas of muscle destruction adjacent to the parasite which appear to be mechanically produced by the parasite. The microtubules within the villus-like projections of the cyst suggest that their possible function is absorptive and/or conductive with regard to the production of a toxin or the conveyance of nutritive material to the developing cells. The proposed function of submembranous filaments and their relation to the conoid is discussed. Similarities in the ultrastructure to Toxoplasma and other protozoa tend to negate the relegation of Sarcocystis to the fungi and further emphasize its protozoan nature.

  1. Inverse photoemission of uranium oxides

    International Nuclear Information System (INIS)

    Roussel, P.; Morrall, P.; Tull, S.J.

    2009-01-01

    Understanding the itinerant-localised bonding role of the 5f electrons in the light actinides will afford an insight into their unusual physical and chemical properties. In recent years, the combination of core and valance band electron spectroscopies with theoretic modelling have already made significant progress in this area. However, information of the unoccupied density of states is still scarce. When compared to the forward photoemission techniques, measurements of the unoccupied states suffer from significantly less sensitivity and lower resolution. In this paper, we report on our experimental apparatus, which is designed to measure the inverse photoemission spectra of the light actinides. Inverse photoemission spectra of UO 2 and UO 2.2 along with the corresponding core and valance electron spectra are presented in this paper. UO 2 has been reported previously, although through its inclusion here it allows us to compare and contrast results from our experimental apparatus to the previous Bremsstrahlung Isochromat Spectroscopy and Inverse Photoemission Spectroscopy investigations

  2. Dental Wear: A Scanning Electron Microscope Study

    Directory of Open Access Journals (Sweden)

    Luca Levrini

    2014-01-01

    Full Text Available Dental wear can be differentiated into different types on the basis of morphological and etiological factors. The present research was carried out on twelve extracted human teeth with dental wear (three teeth showing each type of wear: erosion, attrition, abrasion, and abfraction studied by scanning electron microscopy (SEM. The study aimed, through analysis of the macro- and micromorphological features of the lesions (considering the enamel, dentin, enamel prisms, dentinal tubules, and pulp, to clarify the different clinical and diagnostic presentations of dental wear and their possible significance. Our results, which confirm current knowledge, provide a complete overview of the distinctive morphology of each lesion type. It is important to identify the type of dental wear lesion in order to recognize the contributing etiological factors and, consequently, identify other more complex, nondental disorders (such as gastroesophageal reflux, eating disorders. It is clear that each type of lesion has a specific morphology and mechanism, and further clinical studies are needed to clarify the etiological processes, particularly those underlying the onset of abfraction.

  3. Scanning electron microscopic studies on bone tumors

    International Nuclear Information System (INIS)

    Itoh, Motoya

    1978-01-01

    Surface morphological observations of benign and malinant bone tumors were made by the use of scanning electron microscopy. Tumor materials were obtained directly from patients of osteogenic sarcomas, chondrosarcomas, enchondromas, giant cell tumors and Paget's sarcoma. To compare with these human tumors, the following experimental materials were also observed: P 32 -induced rat osteogenic sarcomas with their pulmonary metastatic lesions, Sr 89 -induced transplantable mouse osteogenic sarcomas and osteoid tissues arising after artificial fractures in mice. One of the most outstanding findings was a lot of granular substances seen on cell surfaces and their intercellular spaces in osteoid or chondroid forming tissues. These substances were considered to do some parts in collaborating extracellular matrix formation. Protrusions on cell surface, such as mucrovilli were more or less fashioned by these granular substances. Additional experiments revealed these substances to be soluble in sodium cloride solution. Benign osteoid forming cells, such as osteoblasts and osteoblastic osteosarcoma cells had granular substances on their surfaces and their intercellular spaces. On the other hand, undifferentiated transplantable osteosarcoma which formed on osteoid or chondroid matrix had none of these granular substances. Consequently, the difference of surface morphology between osteosarcoma cells and osteoblasts was yet to be especially concluded. (author)

  4. Scanning tunnel microscope with large vision field compatible with a scanning electron microscope

    International Nuclear Information System (INIS)

    Volodin, A.P.; Stepanyan, G.A.; Khajkin, M.S.; Ehdel'man, V.S.

    1989-01-01

    A scanning tunnel microscope (STM) with the 20μm vision field and 1nm resolution, designed to be compatible with a scanning electron microscope (SEM), is described. The sample scanning area is chosen within the 3x10mm limits with a 0.1-1μm step. The STM needle is moved automatically toward the sample surface from the maximum distance of 10mm until the tunneling current appears. Bimorphous elements of the KP-1 piezocorrector are used in the STM design. The device is installed on a table of SEM object holders

  5. Energies of rare-earth ion states relative to host bands in optical materials from electron photoemission spectroscopy

    Science.gov (United States)

    Thiel, Charles Warren

    There are a vast number of applications for rare-earth-activated materials and much of today's cutting-edge optical technology and emerging innovations are enabled by their unique properties. In many of these applications, interactions between the rare-earth ion and the host material's electronic states can enhance or inhibit performance and provide mechanisms for manipulating the optical properties. Continued advances in these technologies require knowledge of the relative energies of rare-earth and crystal band states so that properties of available materials may be fully understood and new materials may be logically developed. Conventional and resonant electron photoemission techniques were used to measure 4f electron and valence band binding energies in important optical materials, including YAG, YAlO3, and LiYF4. The photoemission spectra were theoretically modeled and analyzed to accurately determine relative energies. By combining these energies with ultraviolet spectroscopy, binding energies of excited 4fN-15d and 4fN+1 states were determined. While the 4fN ground-state energies vary considerably between different trivalent ions and lie near or below the top of the valence band in optical materials, the lowest 4f N-15d states have similar energies and are near the bottom of the conduction band. As an example for YAG, the Tb3+ 4f N ground state is in the band gap at 0.7 eV above the valence band while the Lu3+ ground state is 4.7 eV below the valence band maximum; however, the lowest 4fN-15d states are 2.2 eV below the conduction band for both ions. We found that a simple model accurately describes the binding energies of the 4fN, 4fN-1 5d, and 4fN+1 states. The model's success across the entire rare-earth series indicates that measurements on two different ions in a host are sufficient to predict the energies of all rare-earth ions in that host. This information provides new insight into electron transfer transitions, luminescence quenching, and valence

  6. Direct characterization of the energy level alignments and molecular components in an organic hetero-junction by integrated photoemission spectroscopy and reflection electron energy loss spectroscopy analysis.

    Science.gov (United States)

    Yun, Dong-Jin; Shin, Weon-Ho; Bulliard, Xavier; Park, Jong Hwan; Kim, Seyun; Chung, Jae Gwan; Kim, Yongsu; Heo, Sung; Kim, Seong Heon

    2016-08-26

    A novel, direct method for the characterization of the energy level alignments at bulk-heterojunction (BHJ)/electrode interfaces on the basis of electronic spectroscopy measurements is proposed. The home-made in situ photoemission system is used to perform x-ray/ultraviolet photoemission spectroscopy (XPS/UPS), reflection electron energy loss spectroscopy (REELS) and inverse photoemission spectroscopy of organic-semiconductors (OSCs) deposited onto a Au substrate. Through this analysis system, we are able to obtain the electronic structures of a boron subphthalocyanine chloride:fullerene (SubPC:C60) BHJ and those of the separate OSC/electrode structures (SubPC/Au and C60/Au). Morphology and chemical composition analyses confirm that the original SubPC and C60 electronic structures remain unchanged in the electrodes prepared. Using this technique, we ascertain that the position and area of the nearest peak to the Fermi energy (EF = 0 eV) in the UPS (REELS) spectra of SubPC:C60 BHJ provide information on the highest occupied molecular orbital level (optical band gap) and combination ratio of the materials, respectively. Thus, extracting the adjusted spectrum from the corresponding SubPC:C60 BHJ UPS (REELS) spectrum reveals its electronic structure, equivalent to that of the C60 materials. This novel analytical approach allows complete energy-level determination for each combination ratio by separating its electronic structure information from the BHJ spectrum.

  7. Electron microscopic observation at low temperature on superconductors

    International Nuclear Information System (INIS)

    Yokota, Yasuhiro; Hashimoto, Hatsujiro; Yoshida, Hiroyuki.

    1991-01-01

    The authors have observed superconducting materials with a high resolution electron microscope at liquid helium temperature. First, observation was carried out on Nb system intermetallic compounds such as Nb 3 Al and Nb 3 Sn of Al 5 type and Nb 3 Ge of 11 type at extremely low temperature. Next, the observation of high temperature superconductive ceramics in the state of superconductivity was attempted. In this paper, first the development of the liquid helium sample holder for a 400 kV electron microscope to realize the observation is reported. Besides, the sample holder of Gatan Co. and an extremely low temperature, high resolution electron microscope with a superconducting lens are described. The purpose of carrying out the electron microscope observation of superconductors at low temperature is the direct observation of the crystalline lattice image in the state of superconductivity. Also the structural transformation from tetragonal crystals to rhombic crystals in Al 5 type superconductors can be observed. The results of observation are reported. (K.I.)

  8. Structure Identification in High-Resolution Transmission Electron Microscopic Images

    DEFF Research Database (Denmark)

    Vestergaard, Jacob Schack; Kling, Jens; Dahl, Anders Bjorholm

    2014-01-01

    A connection between microscopic structure and macroscopic properties is expected for almost all material systems. High-resolution transmission electron microscopy is a technique offering insight into the atomic structure, but the analysis of large image series can be time consuming. The present ...

  9. New Scanning Electron Microscope Used for Cryogenic Tensile Testing

    CERN Multimedia

    Maximilien Brice

    2013-01-01

    At CERN engineering department's installation for cryogenic tensile testing, the new scanning electron microscope (SEM) allows for detailed optical observations to be carried out. Using the SEM, surface coatings and tensile properties of materials can investigated in order to better understand how they behave under different conditions.

  10. Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

    DEFF Research Database (Denmark)

    Liu, Haihua; Schmidt, Søren; Poulsen, Henning Friis

    2011-01-01

    resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D orientation mapping in the transmission electron microscope of mono- and multiphase nanocrystalline materials with a spatial resolution reaching 1 nm. We demonstrate the technique by an experimental study...

  11. On the resolution of the electron microscopic radioautography

    International Nuclear Information System (INIS)

    Uchida, Kazuko; Daimon, Tateo; Kawai, Kazuhiro

    1981-01-01

    The aim of electron microscopic radioautography is to reveal the exact localization of certain substances at the macromolecular level. In order to attain this object the establishment of a fine grain development method is indispensable. Some of latent images are formed at the contact surface between the polyhedral halide silver grain and the section surface, where the impact of #betta# particles come directly from the section involved, and since it is in contact with the section it remains in place even after development and gelatin removal. This latent image finally becomes a developed silver grain in the electron microscope radioautogram. Although the limit of resolution in electron microscopic radioautography is supposed to be the diameter of halide silver grains in emulsion, it may be improved by considering the fact that the contact area between the halide silver grain and the section surface is the minimum unit of resolution. The minimum resolution of electron microscopic radioautography was determined histologically to be about 100A. (author)

  12. Improved coating and fixation methods for scanning electron microscope autoradiography

    International Nuclear Information System (INIS)

    Weiss, R.L.

    1984-01-01

    A simple apparatus for emulsion coating is described. The apparatus is inexpensive and easily assembled in a standard glass shop. Emulsion coating for scanning electron microscope autoradiography with this apparatus consistently yields uniform layers. When used in conjunction with newly described fixation methods, this new approach produces reliable autoradiographs of undamaged specimens

  13. Scanning electron microscope facility for examination of radioactive materials

    International Nuclear Information System (INIS)

    Gibson, J.R.; Braski, D.N.

    1985-02-01

    An AMRAY model 1200B scanning electron microscope was modified to permit remote examination of radioactive specimens. Features of the modification include pneumatic vibration isolation of the column, motorized stage controls, improvements for monitoring vacuum, and a system for changing filaments without entering the hot cell

  14. Space-charge effect in electron time-of-flight analyzer for high-energy photoemission spectroscopy

    International Nuclear Information System (INIS)

    Greco, G.; Verna, A.; Offi, F.; Stefani, G.

    2016-01-01

    Highlights: • Two methods for the simulation of space-charge effect in time-resolved PES. • Reliability and advantages in the use of the SIMION"® software. • Simulation of the space-charge effect in an electron TOF analyzer. • Feasibility of a TOF analyzer in time-resolved high-energy PES experiments at FEL. - Abstract: The space-charge effect, due to the instantaneous emission of many electrons after the absorption of a single photons pulse, causes distortion in the photoelectron energy spectrum. Two calculation methods have been applied to simulate the expansion during a free flight of clouds of mono- and bi-energetic electrons generated by a high energy pulse of light and their results have been compared. The accuracy of a widely used tool, such as SIMION"®, in predicting the energy distortion caused by the space-charge has been tested and the reliability of its results is verified. Finally we used SIMION"® to take into account the space-charge effects in the simulation of simple photoemission experiments with a time-of-flight analyzer.

  15. Heat- and radiation-resistant scintillator for electron microscopes

    International Nuclear Information System (INIS)

    Kosov, A.V.; Petrov, S.A.; Puzyr', A.P.; Chetvergov, N.A.

    1987-01-01

    The use of a scintillator consisting of a single crystal of bismuth orthogermanate, which has high heat and radiation resistance, in REM-100, REM-200, and REM-100U electron microscopes is described. A study of the heat and radiation stabilities of single crystals of bismuth orthogermanate (Bi 4 Ge 3 O 12 ) has shown that they withstood multiple electron-beam heating redness (T ∼ 800 0 C) without changes in their properties

  16. Examples of electrostatic electron optics: The Farrand and Elektros microscopes and electron mirrors

    International Nuclear Information System (INIS)

    Hawkes, P.W.

    2012-01-01

    The role of Gertrude Rempfer in the design of the Farrand and Elektros microscopes is evoked. The study of electron mirror optics, aberration correction using mirrors and the development of microscopes employing electron mirrors are recapitulated, accompanied by a full bibliography, of earlier publications in particular.

  17. Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes

    International Nuclear Information System (INIS)

    Rau, E. I.; Orlikovskiy, N. A.; Ivanova, E. S.

    2012-01-01

    A new highly efficient design for semiconductor detectors of intermediate-energy electrons (1–50 keV) for application in scanning electron microscopes is proposed. Calculations of the response function of advanced detectors and control experiments show that the efficiency of the developed devices increases on average twofold, which is a significant positive factor in the operation of modern electron microscopes in the mode of low currents and at low primary electron energies.

  18. Transmission environmental scanning electron microscope with scintillation gaseous detection device

    International Nuclear Information System (INIS)

    Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

    2015-01-01

    A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. - Highlights: • Novel scanning transmission electron microscopy (STEM) with an environmental scanning electron microscope (ESEM) called TESEM. • Use of the gaseous detection device (GDD) in scintillation mode that allows high resolution bright and dark field imaging in the TESEM. • Novel approach towards a unification of both vacuum and environmental conditions in both bulk/surface and transmission mode of electron microscopy

  19. Closed-Loop Autofocus Scheme for Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Cui Le

    2015-01-01

    Full Text Available In this paper, we present a full scale autofocus approach for scanning electron microscope (SEM. The optimal focus (in-focus position of the microscope is achieved by maximizing the image sharpness using a vision-based closed-loop control scheme. An iterative optimization algorithm has been designed using the sharpness score derived from image gradient information. The proposed method has been implemented and validated using a tungsten gun SEM at various experimental conditions like varying raster scan speed, magnification at real-time. We demonstrate that the proposed autofocus technique is accurate, robust and fast.

  20. Historical evolution toward achieving ultrahigh vacuum in JEOL electron microscopes

    CERN Document Server

    Yoshimura, Nagamitsu

    2014-01-01

    This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of...

  1. Specimen holder for an electron microscope and device and method for mounting a specimen in an electron microscope

    NARCIS (Netherlands)

    Zandbergen, H.W.; Latenstein van Voorst, A.; Westra, C.; Hoveling, G.H.

    1996-01-01

    A specimen holder for an electron microscope, comprising a bar-shaped body provided adjacent one end with means for receiving a specimen, with means being present for screening the specimen from the environment at least temporarily in airtight and moisture-proof manner in a first position, which

  2. Transmission environmental scanning electron microscope with scintillation gaseous detection device.

    Science.gov (United States)

    Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

    2015-03-01

    A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. Copyright © 2014 Elsevier B.V. All rights reserved.

  3. Interfacial electronic structure of C{sub 60}/ZnPc/AZO on photoemission spectroscopy for organic photovoltaic applications

    Energy Technology Data Exchange (ETDEWEB)

    Heo, Nari; Kim, Yoonsu; Jung, Yunwoo; Cheon, Suyoung; Cho, Soohaeng [Department of Physics, Yonsei University, Wonju 220-710 (Korea, Republic of); Cho, Sang Wan, E-mail: dio8027@yonsei.ac.kr [Department of Physics, Yonsei University, Wonju 220-710 (Korea, Republic of); Park, Soohyung; Yi, Yeonjin [Institute of Physics and Applied Physics, Yonsei University, Seoul 120-749 (Korea, Republic of); Smith, Kevin E. [Department of Physics, Boston University, 590 Commonwealth Ave, Boston, MA 02215 (United States)

    2016-10-20

    Highlights: • The electronic structure of a bilayer on AZO has been evaluated by UPS and XPS. • The energy difference between the ZnPc HOMO and the C{sub 60} LUMO was determined. • The result is discussed in terms of the work function and resistivity of each TCO. - Abstract: The interfacial electronic structure of a bilayer of fullerene (C{sub 60}) and zinc phthalocyanine (ZnPc) grown on aluminum-doped zinc oxide (AZO) substrates has been evaluated by X-ray and ultraviolet photoemission spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the ZnPc layer and the lowest unoccupied molecular orbital (LUMO) level of the C{sub 60} layer (E{sup D}{sub HOMO} − E{sup A}{sub LUMO}) was determined and compared to that grown on an indium tin oxide (ITO) substrate. The E{sup D}{sub HOMO} − E{sup A}{sub LUMO} value of the heterojunction on AZO was 1.4 eV, while that on ITO was 1.1 eV. This result is discussed in terms of the differences of the work function and resistivity of each transparent conductive oxide. We also obtained complete energy level diagrams of C{sub 60}/ZnPc/AZO and C{sub 60}/ZnPc/ITO.

  4. Microscopic Electron Variations Measured Simultaneously By The Cluster Spacecraft

    Science.gov (United States)

    Buckley, A. M.; Carozzi, T. D.; Gough, M. P.; Beloff, N.

    Data is used from the Particle Correlator experiments running on each of the four Cluster spacecraft so as to determine common microscopic behaviour in the elec- tron population observed over the macroscopic Cluster separations. The Cluster par- ticle correlator experiments operate by forming on board Auto Correlation Functions (ACFs) generated from short time series of electron counts obtained, as a function of electron energy, from the PEACE HEEA sensor. The information on the microscopic variation of the electron flux covers the frequency range DC up to 41 kHz (encom- passing typical electron plasma frequencies and electron gyro frequencies and their harmonics), the electron energy range is that covered by the PEACE HEEA sensor (within the range 1 eV to 26 keV). Results are presented of coherent electron struc- tures observed simultaneously by the four spacecraft in the differing plasma interac- tion regions and boundaries encountered by Cluster. As an aid to understanding the plasma interactions, use is made of numerical simulations which model both the un- derlying statistical properties of the electrons and also the manner in which particle correlator experiments operate.

  5. Acute radiation nephritis. Light and electron microscopic observations

    International Nuclear Information System (INIS)

    Kapur, S.; Chandra, R.; Antonovych, T.

    1977-01-01

    Light and electron microscopy were used to observe acute radiation nephritis. By light microscopy the changes were of fibrinoid necrosis of the arteries and arterioles with segmental necrosis of the glomerular tufts. By electron microscopy the endocapillary cells reacted by hypertrophy and hyperplasia with increase in cytoplasmic organelles. In addition, disruption of endothelial and epithelial cells from the basement membranes were seen. It is concluded that the electron microscopic changes were unique and may be helpful in differentiating the necrotizing glomerulitis seen in other conditions, especially malignant hypertension

  6. Foucault imaging by using non-dedicated transmission electron microscope

    International Nuclear Information System (INIS)

    Taniguchi, Yoshifumi; Matsumoto, Hiroaki; Harada, Ken

    2012-01-01

    An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

  7. Foucault imaging by using non-dedicated transmission electron microscope

    Science.gov (United States)

    Taniguchi, Yoshifumi; Matsumoto, Hiroaki; Harada, Ken

    2012-08-01

    An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

  8. Foucault imaging by using non-dedicated transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Taniguchi, Yoshifumi [Science and Medical Systems Business Group, Hitachi High-Technologies Corp., Ichige, Hitachinaka, Ibaraki 312-8504 (Japan); Matsumoto, Hiroaki [Corporate Manufacturing Strategy Group, Hitachi High-Technologies Corp., Ishikawa-cho, Hitachinaka, Ibaraki 312-1991 (Japan); Harada, Ken [Central Research Laboratory, Hitachi Ltd., Hatoyama, Saitama 350-0395 (Japan)

    2012-08-27

    An electron optical system for observing Foucault images was constructed using a conventional transmission electron microscope without any special equipment for Lorentz microscopy. The objective lens was switched off and an electron beam was converged by a condenser optical system to the crossover on the selected area aperture plane. The selected area aperture was used as an objective aperture to select the deflected beam for Foucault mode, and the successive image-forming lenses were controlled for observation of the specimen images. The irradiation area on the specimen was controlled by selecting the appropriate diameter of the condenser aperture.

  9. Use of a scanning electron microscope for examining radioactive materials

    International Nuclear Information System (INIS)

    Kauffmann, Yves; Prouve, Michel.

    1981-05-01

    The LAMA laboratory of the Grenoble Nuclear Research Center participates in studies carried out by research teams on fuels. Post-irradiation studies are performed on irradiated pins for research and development and safety programs. A scanning electron microscope was acquired for this purpose. This microscope had to fulfill certain criteria: it had to be sufficiently compact for it to be housed in a lead enclosure; it had to be capable of being adapted to operate with remote handling control. The modifications made to this microscope are briefly described together with the ancillary equipment of the cell. In parallel with these operations, an interconnection was realized enabling materials to be transferred between the various sampling and sample preparation cells and the microscope cell with a small transfer cask. After two years operating experience the microscope performance has been assessed satisfactory. The specific radioactivity of the samples themselves cannot be incriminated as the only cause of loss in resolution at magnifications greater than x 10,000 [fr

  10. Electronic properties of metal-organic and organic-organic interfaces studied by photoemission and photoabsorption spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Molodtsova, Olga

    2006-07-01

    In this work systematic studies of the organic semiconductor CuPc have been presented. In general the investigation can be devided in three parts. In the first one we have studied the electronic structure of clean CuPc thin film. The next two parts are devoted to organic-organic and metal-organic interface formation, where one of the interface components is CuPc thin film. The main results of this thesis are: - The electronic structure of the pristine organic semiconductor CuPc has been obtained by a combination of conventional and resonant photoemission, near-edge X-ray absorption, as well as by theoretical ab initio quantum-chemical calculations. The contributions of different atomic species as well as sites of the CuPc molecule to the electronic DOS has been established. A combined experimental and theoretical study of the unoccupied electronic density of states of CuPc was presented. - The electronic properties of the organic heterointerfaces between fullerite and pristine copper phthalocyanine were studied. Both interfaces, CuPc/C{sub 60} and C{sub 60}/CuPc, were found to be non-reactive with pronounced shifts of the vacuum level pointing to the formation of an interfacial dipole mainly at the CuPc side of the heterojunctions. The dipole values are close to the difference of the work functions of the two materials. Important interface parameters and hole-injection barriers were obtained. The sequence of deposition does not influence the electronic properties of the interfaces. - CuPc doped with potassium was studied by means of photoemission and photoabsorption spectroscopy. A detailed analysis of the core-level PE spectra allows one to propose possible lattice sites, which harbor the potassium ions. The films prepared in this thesis showed no finite electronic density of states at the Fermi level. - Two stages of the In/CuPc interface formation have been distinguished. The low-coverage stage is characterized by a strong diffusion of the In atoms into the

  11. Electronic structure of YbNiX{sub 3} (X =Si, Ge) studied by hard X-ray photoemission spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Sato, Hitoshi; Shimada, Kenya; Namatame, Hirofumi [Hiroshima Synchrotron Radiation Center, Hiroshima University, Kagamiyama 2-313, Higashi-Hiroshima 739-0046 (Japan); Utsumi, Yuki [Max-Planck Institute for Chemical Physics of Solids, 01187 Dresden (Germany); Kodama, Junichi; Nagata, Heisuke [Graduate School of Science, Hiroshima University, Kagamiyama 1-3-1, Higashi-Hiroshima 739-8526 (Japan); Avila, Marcos A.; Ribeiro, Raquel A. [Centro de Ciencias Naturais e Humanas, Universidade Federal do ABC, Santo Andre - SP, 09210-580 (Brazil); Umeo, Kazunori [Cryogenics and Instrumental Analysis Division, N-BARD, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan); Takabatake, Toshiro [Department of Quantum Matter, AdSM, Hiroshima University, Higashi-Hiroshima 739-8530 (Japan); Institute for Advanced Materials Research, Hiroshima University, Higashi-Hiroshima 739-8530 (Japan); Mimura, Kojiro; Motonami, Satoru; Anzai, Hiroaki [Graduate School of Engineering, Osaka Prefecture University, Sakai 599-8531 (Japan); Ueda, Shigenori [Synchrotron X-ray Station at SPring-8, National Institute for Materials Science, Hyogo 679-5148 (Japan); Taniguchi, Masaki [Hiroshima Synchrotron Radiation Center, Hiroshima University, Kagamiyama 2-313, Higashi-Hiroshima 739-0046 (Japan); Graduate School of Science, Hiroshima University, Kagamiyama 1-3-1, Higashi-Hiroshima 739-8526 (Japan)

    2015-06-15

    lectronic structure of the Kondo lattices YbNiX{sub 3} (X =Si, Ge) has been investigated by means of hard x-ray photoemission spectroscopy (HAXPES) with hν = 5.95 keV. From the Yb 3d HAXPES spectra, the Yb valence in YbNiSi{sub 3} is estimated to be ∝ 2.92, which is almost temperature-independent. On the other hand, the valence in YbNiGe{sub 3} is estimated to be 2.48 at 300 K, showing significant valence fluctuation, and gradually decreases to 2.41 at 20 K on cooling. The Ni 2p{sub 3/2} and Yb{sup 3+} 4f peaks exhibit opposite energy shifts amounting to ∝ 0.6 eV between YbNiSi{sub 3} and YbNiGe{sub 3}. We propose a simple model for the electronic structure of YbNiX{sub 3} based on the HAXPES results. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  12. Characterization of quantum well structures using a photocathode electron microscope

    Science.gov (United States)

    Spencer, Michael G.; Scott, Craig J.

    1989-01-01

    Present day integrated circuits pose a challenge to conventional electronic and mechanical test methods. Feature sizes in the submicron and nanometric regime require radical approaches in order to facilitate electrical contact to circuits and devices being tested. In addition, microwave operating frequencies require careful attention to distributed effects when considering the electrical signal paths within and external to the device under test. An alternative testing approach which combines the best of electrical and optical time domain testing is presented, namely photocathode electron microscope quantitative voltage contrast (PEMQVC).

  13. Pulsed Power for a Dynamic Transmission Electron Microscope

    Energy Technology Data Exchange (ETDEWEB)

    dehope, w j; browning, n; campbell, g; cook, e; king, w; lagrange, t; reed, b; stuart, b; Shuttlesworth, R; Pyke, B

    2009-06-25

    Lawrence Livermore National Laboratory (LLNL) has converted a commercial 200kV transmission electron microscope (TEM) into an ultrafast, nanoscale diagnostic tool for material science studies. The resulting Dynamic Transmission Electron Microscope (DTEM) has provided a unique tool for the study of material phase transitions, reaction front analyses, and other studies in the fields of chemistry, materials science, and biology. The TEM's thermionic electron emission source was replaced with a fast photocathode and a laser beam path was provided for ultraviolet surface illumination. The resulting photoelectron beam gives downstream images of 2 and 20 ns exposure times at 100 and 10 nm spatial resolution. A separate laser, used as a pump pulse, is used to heat, ignite, or shock samples while the photocathode electron pulses, carefully time-synchronized with the pump, function as probe in fast transient studies. The device functions in both imaging and diffraction modes. A laser upgrade is underway to make arbitrary cathode pulse trains of variable pulse width of 10-1000 ns. Along with a fast e-beam deflection scheme, a 'movie mode' capability will be added to this unique diagnostic tool. This talk will review conventional electron microscopy and its limitations, discuss the development and capabilities of DTEM, in particularly addressing the prime and pulsed power considerations in the design and fabrication of the DTEM, and conclude with the presentation of a deflector and solid-state pulser design for Movie-Mode DTEM.

  14. Pulsed Power for a Dynamic Transmission Electron Microscope

    International Nuclear Information System (INIS)

    DeHope, W.J.; Browning, N.; Campbell, G.; Cook, E.; King, W.; Lagrange, T.; Reed, B.; Stuart, B.; Shuttlesworth, R.; Pyke, B.

    2009-01-01

    Lawrence Livermore National Laboratory (LLNL) has converted a commercial 200kV transmission electron microscope (TEM) into an ultrafast, nanoscale diagnostic tool for material science studies. The resulting Dynamic Transmission Electron Microscope (DTEM) has provided a unique tool for the study of material phase transitions, reaction front analyses, and other studies in the fields of chemistry, materials science, and biology. The TEM's thermionic electron emission source was replaced with a fast photocathode and a laser beam path was provided for ultraviolet surface illumination. The resulting photoelectron beam gives downstream images of 2 and 20 ns exposure times at 100 and 10 nm spatial resolution. A separate laser, used as a pump pulse, is used to heat, ignite, or shock samples while the photocathode electron pulses, carefully time-synchronized with the pump, function as probe in fast transient studies. The device functions in both imaging and diffraction modes. A laser upgrade is underway to make arbitrary cathode pulse trains of variable pulse width of 10-1000 ns. Along with a fast e-beam deflection scheme, a 'movie mode' capability will be added to this unique diagnostic tool. This talk will review conventional electron microscopy and its limitations, discuss the development and capabilities of DTEM, in particularly addressing the prime and pulsed power considerations in the design and fabrication of the DTEM, and conclude with the presentation of a deflector and solid-state pulser design for Movie-Mode DTEM

  15. A new clustering algorithm for scanning electron microscope images

    Science.gov (United States)

    Yousef, Amr; Duraisamy, Prakash; Karim, Mohammad

    2016-04-01

    A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with the sample atoms, producing various signals that are collected by detectors. The gathered signals contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. The most common configuration for an SEM produces a single value per pixel, with the results usually rendered as grayscale images. The captured images may be produced with insufficient brightness, anomalous contrast, jagged edges, and poor quality due to low signal-to-noise ratio, grained topography and poor surface details. The segmentation of the SEM images is a tackling problems in the presence of the previously mentioned distortions. In this paper, we are stressing on the clustering of these type of images. In that sense, we evaluate the performance of the well-known unsupervised clustering and classification techniques such as connectivity based clustering (hierarchical clustering), centroid-based clustering, distribution-based clustering and density-based clustering. Furthermore, we propose a new spatial fuzzy clustering technique that works efficiently on this type of images and compare its results against these regular techniques in terms of clustering validation metrics.

  16. Role of scanning electron microscope )SEM) in metal failure analysis

    International Nuclear Information System (INIS)

    Shaiful Rizam Shamsudin; Hafizal Yazid; Mohd Harun; Siti Selina Abd Hamid; Nadira Kamarudin; Zaiton Selamat; Mohd Shariff Sattar; Muhamad Jalil

    2005-01-01

    Scanning electron microscope (SEM) is a scientific instrument that uses a beam of highly energetic electrons to examine the surface and phase distribution of specimens on a micro scale through the live imaging of secondary electrons (SE) and back-scattered electrons (BSE) images. One of the main activities of SEM Laboratory at MINT is for failure analysis on metal part and components. The capability of SEM is excellent for determining the root cause of metal failures such as ductility or brittleness, stress corrosion, fatigue and other types of failures. Most of our customers that request for failure analysis are from local petrochemical plants, manufacturers of automotive components, pipeline maintenance personnel and engineers who involved in the development of metal parts and component. This paper intends to discuss some of the technical concepts in failure analysis associated with SEM. (Author)

  17. Beamline for Photoemission Spectromicroscopy and Spin Polarized Microscopy with Slow Electrons at CESLAB

    Czech Academy of Sciences Publication Activity Database

    Frank, Luděk

    2008-01-01

    Roč. 15, č. 1 (2008), s. 111-112 ISSN 1210-8529 Institutional research plan: CEZ:AV0Z20650511 Keywords : CESLAB * beamline * LEEM/PEEM Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

  18. Adaptive electron beam shaping using a photoemission gun and spatial light modulator

    Science.gov (United States)

    Maxson, Jared; Lee, Hyeri; Bartnik, Adam C.; Kiefer, Jacob; Bazarov, Ivan

    2015-02-01

    The need for precisely defined beam shapes in photoelectron sources has been well established. In this paper, we use a spatial light modulator and simple shaping algorithm to create arbitrary, detailed transverse laser shapes with high fidelity. We transmit this shaped laser to the photocathode of a high voltage dc gun. Using beam currents where space charge is negligible, and using an imaging solenoid and fluorescent viewscreen, we show that the resultant beam shape preserves these detailed features with similar fidelity. Next, instead of transmitting a shaped laser profile, we use an active feedback on the unshaped electron beam image to create equally accurate and detailed shapes. We demonstrate that this electron beam feedback has the added advantage of correcting for electron optical aberrations, yielding shapes without skew. The method may serve to provide precisely defined electron beams for low current target experiments, space-charge dominated beam commissioning, as well as for online adaptive correction of photocathode quantum efficiency degradation.

  19. Investigations of the physical properties of photoemission polarized electron sources for accelerator applications

    International Nuclear Information System (INIS)

    Dunham, B.M.

    1993-01-01

    This experiment measured the polarization and quantum efficiency as a function of wavelength for the chalcopyrite semiconductor Zn (Ge 0.7 Si 0.3 )As 2 . Also, the onset of space charge growth of a 100 keV electron beam passing through the Illinois/CEBAF polarized electron injection system was studied by measuring the beam emittance as a function of current. Finally the thermal properties of GaAs were investigated by measuring the beam emittance as functions of the excitation laser wavelength and the laser spot size. The experiments were performed of Zn(Ge 0.7 Si 0.3 )As 2 was measured to be ∼19%, much lower than the expected 100%. Also, the expected emittance as a function of current was measured and the onset of space charge effects was found to be ∼0.5 mA, much lower than predicted by the electron gun design program EGUN. Finally, the effective transverse thermal energy of the electrons emitted from GaAs at 100 keV as a function of excitation wavelength was measured by a new method for low beam currents. The electron thermal energy for wavelengths between 840 and 633 nm was found to be ∼33 meV, a factor of 3 lower than for a thermionic electron gun. It was found to increase sharply for photon wavelengths less than 633 nm

  20. Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

    International Nuclear Information System (INIS)

    Molhave, Kristian; Gudnason, Sven Bjarke; Pedersen, Anders Tegtmeier; Clausen, Casper Hyttel; Horsewell, Andy; Boggild, Peter

    2007-01-01

    Observations of carbon nanotubes under exposure to electron beam irradiation in standard transmission electron microscope (TEM) and scanning electron microscope (SEM) systems show that such treatment in some cases can cause severe damage of the nanotube structure, even at electron energies far below the approximate 100 keV threshold for knock-on damage displacing carbon atoms in the graphene structure. We find that the damage we observe in one TEM can be avoided by use of a cold finger. This and the morphology of the damage imply that water vapour, which is present as a background gas in many vacuum chambers, can damage the nanotube structure through electron beam-induced chemical reactions. Though, the dependence on the background gas makes these observations specific for the presently used systems, the results demonstrate the importance of careful assessment of the level of subtle structural damage that the individual electron microscope system can do to nanostructures during standard use

  1. Microscopic Electron Dynamics in Metal Nanoparticles for Photovoltaic Systems

    Directory of Open Access Journals (Sweden)

    Katarzyna Kluczyk

    2018-06-01

    Full Text Available Nanoparticles—regularly patterned or randomly dispersed—are a key ingredient for emerging technologies in photonics. Of particular interest are scattering and field enhancement effects of metal nanoparticles for energy harvesting and converting systems. An often neglected aspect in the modeling of nanoparticles are light interaction effects at the ultimate nanoscale beyond classical electrodynamics. Those arise from microscopic electron dynamics in confined systems, the accelerated motion in the plasmon oscillation and the quantum nature of the free electron gas in metals, such as Coulomb repulsion and electron diffusion. We give a detailed account on free electron phenomena in metal nanoparticles and discuss analytic expressions stemming from microscopic (Random Phase Approximation—RPA and semi-classical (hydrodynamic theories. These can be incorporated into standard computational schemes to produce more reliable results on the optical properties of metal nanoparticles. We combine these solutions into a single framework and study systematically their joint impact on isolated Au, Ag, and Al nanoparticles as well as dimer structures. The spectral position of the plasmon resonance and its broadening as well as local field enhancement show an intriguing dependence on the particle size due to the relevance of additional damping channels.

  2. Cooled CCDs for recording data from electron microscopes

    CERN Document Server

    Faruqi, A R

    2000-01-01

    A cooled-CCD camera based on a low-noise scientific grade device is described in this paper used for recording images in a 120 kV electron microscope. The primary use of the camera is for recording electron diffraction patterns from two-dimensionally ordered arrays of proteins at liquid-nitrogen temperatures leading to structure determination at atomic or near-atomic resolution. The traditional method for recording data in the microscope is with electron sensitive film but electronic detection methods offer the following advantages over film methods: the data is immediately available in a digital format which can be displayed on a monitor screen for visual inspection whereas a film record needs to be developed and digitised, a lengthy process taking at least several hours, prior to inspection; the dynamic range of CCD detectors is about two orders of magnitude greater with better linearity. The accuracy of measurements is also higher for CCDs, particularly for weak signals due to inherent fog levels in film. ...

  3. Dynamical Processes in Open Quantum Systems from a TDDFT Perspective: Resonances and Electron Photoemission.

    Science.gov (United States)

    Larsen, Ask Hjorth; De Giovannini, Umberto; Rubio, Angel

    2016-01-01

    We present a review of different computational methods to describe time-dependent phenomena in open quantum systems and their extension to a density-functional framework. We focus the discussion on electron emission processes in atoms and molecules addressing excited-state lifetimes and dissipative processes. Initially we analyze the concept of an electronic resonance, a central concept in spectroscopy associated with a metastable state from which an electron eventually escapes (electronic lifetime). Resonances play a fundamental role in many time-dependent molecular phenomena but can be rationalized from a time-independent context in terms of scattering states. We introduce the method of complex scaling, which is used to capture resonant states as localized states in the spirit of usual bound-state methods, and work on its extension to static and time-dependent density-functional theory. In a time-dependent setting, complex scaling can be used to describe excitations in the continuum as well as wave packet dynamics leading to electron emission. This process can also be treated by using open boundary conditions which allow time-dependent simulations of emission processes without artificial reflections at the boundaries (i.e., borders of the simulation box). We compare in detail different schemes to implement open boundaries, namely transparent boundaries using Green functions, and absorbing boundaries in the form of complex absorbing potentials and mask functions. The last two are regularly used together with time-dependent density-functional theory to describe the electron emission dynamics of atoms and molecules. Finally, we discuss approaches to the calculation of energy and angle-resolved time-dependent pump-probe photoelectron spectroscopy of molecular systems.

  4. Electronic structure of ion arsenic high temperature superconductors studied by angle resolved photoemission spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Liu, Chang [Iowa State Univ., Ames, IA (United States)

    2011-01-01

    The main purpose of the present thesis is to present our ARPES results on the iron arsenic superconductors. As revealed by a series of ARPES measurements on both the AEFe2As2 and the RFeAs(O,F) families (parent compound and carrier-doped systems), the electronic structures of the pnictides are complicated, three dimensional, and closely linked to their superconducting behavior (13; 14; 15; 16; 17; 18; 19). Parent compounds of these materials exhibit the basic hole-electron pocket dual plus an apparent Fermi surface reconstruction caused by long range antiferromagnetism (13; 15). When carriers are introduced, the chemical potential shifts in accordance with the Luttinger theorem and the rigid band shifting picture (13). Importantly, both the appearance and disappearance of the superconducting dome at low and high doping levels have intimate relation with topological changes at the Fermi surfaces, resulting in a specific Fermi topology being favored by superconductivity (15; 16). On the low doping side, superconductivity emerges in the phase diagram once the antiferromagnetic reconstruction disappears below the Fermi level, returning the Fermi surface to its paramagnetic-like appearance. On the high doping side, superconductivity disappears around a doping level at which the central hole pocket vanishes due to increasing electron concentration. Such phenomena are evidence for the governing role the electronic structure plays in their superconducting behavior.

  5. Measurement of electron beam polarization produced by photoemission from bulk GaAs using twisted light

    Science.gov (United States)

    Clayburn, Nathan; Dreiling, Joan; McCarter, James; Ryan, Dominic; Poelker, Matt; Gay, Timothy

    2012-06-01

    GaAs photocathodes produce spin polarized electron beams when illuminated with circularly polarized light with photon energy approximately equal to the bandgap energy [1, 2]. A typical polarization value obtained with bulk GaAs and conventional circularly polarized light is 35%. This study investigated the spin polarization of electron beams emitted from GaAs illuminated with ``twisted light,'' an expression that describes a beam of light having orbital angular momentum (OAM). In the experiment, 790nm laser light was focused to a near diffraction-limited spot size on the surface of the GaAs photocathode to determine if OAM might couple to valence band electron spin mediated by the GaAs lattice. Our polarization measurements using a compact retarding-field micro-Mott polarimeter [3] have established an upper bound on the polarization of the emitted electron beam of 2.5%. [4pt] [1] D.T. Pierce, F. Meier, P. Zurcher, Appl. Phys. Lett. 26 670 (1975).[0pt] [2] C.K. Sinclair, et al., PRSTAB 10 023501 (2007).[0pt] [3] J.L. McCarter, M.L. Stutzman, K.W. Trantham, T.G. Anderson, A.M. Cook, and T.J. Gay Nucl. Instrum. and Meth. A (2010).

  6. Adaptive electron beam shaping using a photoemission gun and spatial light modulator

    Directory of Open Access Journals (Sweden)

    Jared Maxson

    2015-02-01

    Full Text Available The need for precisely defined beam shapes in photoelectron sources has been well established. In this paper, we use a spatial light modulator and simple shaping algorithm to create arbitrary, detailed transverse laser shapes with high fidelity. We transmit this shaped laser to the photocathode of a high voltage dc gun. Using beam currents where space charge is negligible, and using an imaging solenoid and fluorescent viewscreen, we show that the resultant beam shape preserves these detailed features with similar fidelity. Next, instead of transmitting a shaped laser profile, we use an active feedback on the unshaped electron beam image to create equally accurate and detailed shapes. We demonstrate that this electron beam feedback has the added advantage of correcting for electron optical aberrations, yielding shapes without skew. The method may serve to provide precisely defined electron beams for low current target experiments, space-charge dominated beam commissioning, as well as for online adaptive correction of photocathode quantum efficiency degradation.

  7. EDITORIAL: World Year of Physics 2005 Focus on Photoemission and Electronic Structure

    Science.gov (United States)

    2005-04-01

    Around the year 1500, Leonardo da Vinci designed the first mechanical calculator connecting a number of toothed wheels for simple adding operations. Since then, mechanical systems have become a major part of the later industrial revolutions with an abundance of machines in our everyday lives. Only with the advent of semiconductor electronics, however, did microstructuring techniques become available to realize mechanical systems with dimensions below 100 microns. With most recent structure sizes now reaching the limit of a few nanometres, suspended nanostructures that couple mechanical with electronic motion have been constructed. Moreover, novel lithographic techniques have enabled the investigation of transport across hybrid structures such as. suspended carbon nanotubes or flexible molecular bridges connected to mesoscopic leads. In this invited focus issue of New Journal of Physics some of the leading experts in the field of nano-electromechanical systems (NEMS) describe the latest status and trends, from both an experimental and a theoretical perspective. A multitude of applications for NEMS are now within reach, ranging from high-frequency filters and switches in signal processing circuits, to ultra-sensitive sensors. In particular the development of mass sensors and scanning probe microscopy will be spurred by nano-mechanical systems. Considering that mechanical resonance frequencies of 1 GHz and more have already been achieved, these devices will be extremely sensitive and will offer high data acquisition rates. On a fundamental level NEMS enable the investigation of electron-phonon coupling in the absolute limit via, for example, single electrons interacting with single (quantized) phonons, the study of single electrons being shuttled via mechanical motion, and the manipulation of single molecules with nano-mechanical tweezers. The future for NEMS research looks certain to be exciting - we can expect it to help us build detectors of virtually any kind

  8. In situ laser processing in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

    2012-07-15

    Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

  9. Doping the Copper-Oxygen Planes with Electrons: The View with Photoemission

    Energy Technology Data Exchange (ETDEWEB)

    Armitage, Norman P.

    2002-03-07

    The undoped parent compounds of high-temperature cuprate superconductors are known to be antiferromagnetic Mott insulators. As the CuO{sub 2} planes are doped with charge carriers, the antiferromagnetic phase subsides and superconductivity emerges. The symmetry, or the lack thereof, between doping with electrons (n-type) or holes (p-type) has important theoretical implications as most models implicitly assume symmetry. However, most of what we know about these superconductors comes from experiments performed on p-type materials. The much fewer number of measurements from n-type compounds suggest that there may be both commonalities and differences between the two sides of the phase diagram. This issue of electron/hole symmetry has not been seriously discussed, perhaps, because the experimental database of n-type results is very limited.

  10. Electronic structure of the Ga1-xCrxN studied by high-energy photoemission spectroscopy

    International Nuclear Information System (INIS)

    Kim, J.J.; Makino, H.; Hanada, T.; Cho, M.W.; Yao, T.; Takata, Y.; Nishino, Y.; Tamasaku, K.; Ishikawa, T.; Shin, S.; Kobayashi, K.; Ikenaga, E.; Yabashi, M.; Yamamoto, T.

    2004-01-01

    Full text: It is predicted based on hole-mediated ferromagnetism (FM) that GaMnN may have Curie temperature (Tc) higher than room temperature if doped with high hole concentration (ca 10 20 cm -3 ). The hole-mediated ferromagnetism (FM) can produce reliable estimate of Tc for diluted magnetic semiconductor (DMS) such as GaMnAs due to the shallow Mn-associated energy states in the GaAs system. Since the energy states of doped transition metals exist as a deep level in a wide band semiconductor like GaN and carriers are localized in these states, different mechanisms for magnetism will play a role in GaN rather than the hole-mediated one. This conjecture is partly supported by the recent report of FM in n-type GaN doped with Cr, although the mechanism of the observed FM has not been elucidated yet. In order to get insight into the mechanism of the FM, we have studied the electronic structure of GaN doped with Cr exploiting bulk-sensitive hard X-ray photoemission spectroscopy at a photon energy of 5.95keV at SPring-8. We have observed that Cr-doping does introduce new electronic levels in the band gap and causes some change in the valence band structure. Based on the first principle calculation, the Cr-associated electronic levels in the band gap are assigned to nonbonding and anti-bonding d states, the latter of which pins the Fermi level, while the change of the valence band suggests that the Ga 4s originated states are significantly modified through hybridization with the Cr 3d orbital. The present result evidences that the Ga valence electrons are considerably modified through the interaction with second neighbor Cr atoms. Such hybridization between Ga 4s and Cr 3d may play a significant role in the observed ferromagnetism in Ga 1-x Cr x N

  11. Electron and hole photoemission detection for band offset determination of tunnel field-effect transistor heterojunctions

    International Nuclear Information System (INIS)

    Li, Wei; Zhang, Qin; Kirillov, Oleg A.; Levin, Igor; Richter, Curt A.; Gundlach, David J.; Nguyen, N. V.; Bijesh, R.; Datta, S.; Liang, Yiran; Peng, Lian-Mao; Liang, Xuelei

    2014-01-01

    We report experimental methods to ascertain a complete energy band alignment of a broken-gap tunnel field-effect transistor based on an InAs/GaSb hetero-junction. By using graphene as an optically transparent electrode, both the electron and hole barrier heights at the InAs/GaSb interface can be quantified. For a Al 2 O 3 /InAs/GaSb layer structure, the barrier height from the top of the InAs and GaSb valence bands to the bottom of the Al 2 O 3 conduction band is inferred from electron emission whereas hole emissions reveal the barrier height from the top of the Al 2 O 3 valence band to the bottom of the InAs and GaSb conduction bands. Subsequently, the offset parameter at the broken gap InAs/GaSb interface is extracted and thus can be used to facilitate the development of predicted models of electron quantum tunneling efficiency and transistor performance

  12. Growth of metastable fcc Mn thin film on GaAs(001) and its electronic structure studied by photoemission with synchrotron radiation

    International Nuclear Information System (INIS)

    Chen Yan; Dong Guosheng; Zhang Ming

    1995-01-01

    The epitaxial growth of metastable fcc Mn thin films on GaAs(001) surface has been achieved at a substrate temperature of 400 K. The development of the fcc Mn thin films as a function of coverage is studied by photoemission with synchrotron radiation. The electron density of states below the Fermi edge of the fcc Mn phase is measured. A significant difference of the electronic structures is observed between the metastable fcc Mn phase and the thermodynamically stable α-Mn phase. Possible mechanisms are proposed to interpret the experimental result

  13. Characteristics of different frequency ranges in scanning electron microscope images

    International Nuclear Information System (INIS)

    Sim, K. S.; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S.

    2015-01-01

    We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement

  14. Characteristics of different frequency ranges in scanning electron microscope images

    Energy Technology Data Exchange (ETDEWEB)

    Sim, K. S., E-mail: kssim@mmu.edu.my; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S. [Faculty of Engineering and Technology, Multimedia University, 75450 Melaka (Malaysia)

    2015-07-22

    We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement.

  15. Fabrication and electric measurements of nanostructures inside transmission electron microscope.

    Science.gov (United States)

    Chen, Qing; Peng, Lian-Mao

    2011-06-01

    Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure-property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM. Copyright © 2011 Elsevier B.V. All rights reserved.

  16. Synchrotron-based photoemission study of electronic structure of the Cs/GaN ultrathin interface

    Science.gov (United States)

    Benemanskaya, G. V.; Kukushkin, S. A.; Dementev, P. A.; Lapushkin, M. N.; Timoshnev, S. N.; Smirnov, D. V.

    2018-03-01

    Electronic structure of the Cs/n-GaN nano-interface has been studied in situ via synchrotron-based photoelectron spectroscopy by excitation in the energy range of 70-400 eV. The GaN sample was grown by an original method of epitaxy of low-defect unstressed nanoscaled films on AlGaN/SiC/Si substrate. Changes in the surface state spectra and in the Ga 3d, Cs 4d, Cs 5p, N 1s core level spectra have been revealed under different cesium coverages. The intrinsic surface states for the clean GaN surface at binding energies of ∼5.0 eV and ∼7.0 eV are attenuated during Cs adsorption. Simultaneously three Cs induced surface states are found to arise. Drastic changes in the surface state spectrum were ascertained and shown to be originated from the local interacting Ga dangling bonds and adsorbed Cs atoms initiating the electron redistribution effect with formation of the semiconductor-like Cs/n-GaN interface.

  17. Development of spin-polarized transmission electron microscope

    International Nuclear Information System (INIS)

    Kuwahara, M; Saitoh, K; Tanaka, N; Takeda, Y; Ujihara, T; Asano, H; Nakanishi, T

    2011-01-01

    In order to study spin related phenomena in nano-size materials, spin-polarized electron source (PES) has been employed for the incident beam in transmission electron microscope (TEM). The PES has been designed and constructed with optimizing for spin-polarized TEM. The illuminating system of TEM is also designed to focus the spin-polarized electron beam emitted from a semiconductor photocathode with a negative electron affinity (NEA) surface. The beam energy is set to below 40 keV which is lower energy type as a TEM, because the spin interaction with condensed matters is very small corresponding with a Coulomb interaction. The polarized electron gun has realized in an extra high vacuum (XHV) condition and high field gradient of 4 MV/m on a surface of photocathode. Furthermore, it demonstrated that 40-keV polarized electron beam was operated with a sub-milli second pulse mode by using the backside excitation type photocathode. This high performance PES will make it possible to observe dynamically a magnetic field images with high contrast and highspeed temporal imaging in TEM.

  18. Photoemission in strongly correlated crystalline f-electron systems: A need for a new approach

    International Nuclear Information System (INIS)

    Arko, A.J.; Joyce, J.J.; Sarrao, J.

    1998-01-01

    The unusual properties of heavy fermion (or heavy electron) materials have sparked an avalanche of research over the last two decades in order to understand the basic phenomena responsible for these properties. Photoelectron spectroscopy (often referred to as PES in the following sections), the most direct measurement of the electronic structure of a material, should in principle be able to shed considerable light on this matter. In general the distinction between a localized and a band-like state is trivially observed in band dispersion. Much of the past work was performed on poly-crystalline samples, scraped in-situ to expose a clean surface for PES. There have since been considerable advances both in the quality of specimens as well as experimental resolution, which raise questions regarding these conclusions. Much of the past work on poly-crystalline samples has been reported in several review articles, most notably Allen et al., and it is not necessary here to review those efforts again, with the exception of subsequent work performed at high resolution. The primary focus of the present review will be on new measurements obtained on single crystals, cleaved or prepared in situ and measured at high resolution, which seem to suggest that agreement with the GS and NCA approximations is less than perfect, and that perhaps the starting models need to be modified, or that even an entirely new approach is called for. Of the promising new models the Periodic Anderson Model is most closely related to the SIM. Indeed, at high temperatures it reverts to the SIM. However, the charge polaron model of Liu (1997) as well as the two-electron band model of Sheng and Cooper (1995) cannot yet be ruled out. Inasmuch as the bulk of the single crystal work was performed by the Los Alamos group, this review will draw heavily on those results. Moreover, since the GS and NCA approximations represent the most comprehensive and widely accepted treatment of heavy fermion PES, it is only

  19. Electronic Structure of Fe-Pd Alloys Studied by Using Photoemission Spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Nahm, T-U. [Hanyang University, Seoul (Korea, Republic of)

    2017-07-15

    We investigated the electronic structure of Fe{sub x}Pd{sub 1−x} (x = 0.25, 0.5, and 0.75) alloys by measuring valence-band and core-level photoelectron spectra. The Fe 3d and Pd 4d partial spectral weights were determined by using the Cooper minimum phenomenon of the Pd 4d photoionization cross section. We found that the experimentally determined Fe partial spectral weight of Fe{sub 50}Pd{sub 50} alloy differ much from the band calculation results, and we could not observe a spectral structure due to the Pd 4d states mixed with the Fe 3d majority states at the binding energy of 0.9 eV. We suggest that a plausible explanation for these discrepancies should be the spin-dependent lifetime of the Fe 3d states.

  20. Measurement of electron beam polarization from unstrained GaAs via two-photon photoemission

    Energy Technology Data Exchange (ETDEWEB)

    McCarter, J.L., E-mail: jlm2ar@virginia.edu [Department of Physics, University of Virginia, Charlottesville, VA 22901 (United States); Afanasev, A. [Department of Physics, The George Washington University, Washington, DC 20052 (United States); Gay, T.J. [Jorgensen Hall, University of Nebraska, Lincoln, NE 68588 (United States); Hansknecht, J. [Thomas Jefferson National Accelerator Facility, 12050 Jefferson Avenue, Suite 500, Newport News, VA 23606 (United States); Kechiantz, A. [Department of Physics, The George Washington University, Washington, DC 20052 (United States); Poelker, M. [Thomas Jefferson National Accelerator Facility, 12050 Jefferson Avenue, Suite 500, Newport News, VA 23606 (United States)

    2014-02-21

    Two-photon absorption of 1560 nm light was used to generate polarized electron beams from unstrained GaAs photocathodes of varying thickness: 625 μm, 0.32 μm, and 0.18 μm. For each photocathode, the degree of spin polarization of the photoemitted beam was less than 50%, contradicting earlier predictions based on simple quantum mechanical selection rules for spherically-symmetric systems but consistent with the more sophisticated model of Bhat et al. (Phys. Rev. B 71 (2005) 035209). Polarization via two-photon absorption was the highest from the thinnest photocathode sample and comparable to that obtained via one-photon absorption (using 778 nm light), with values 40.3±1.0% and 42.6±1.0%, respectively.

  1. Local Electronic and Magnetic Structure of Ni below and above TC: A Spin-Resolved Circularly Polarized Resonant Photoemission Study

    NARCIS (Netherlands)

    Sinkovic, B.; Tjeng, L.H.; Brookes, N.B.; Goedkoop, J.B.; Hesper, R.; Pellegrin, E.; Groot, F.M.F. de; Altieri, S.; Hulbert, S.L.; Shekel, E.; Sawatzky, G.A.

    1997-01-01

    We report the measurement of the local Ni 3d spin polarization, not only below but also above the Curie temperature (TC), using the newly developed spin-resolved circularly polarized 2p (L3) resonant photoemission technique. The experiment identifies the presence of 3d8 singlets at high energies

  2. Resizing metal-coated nanopores using a scanning electron microscope.

    Science.gov (United States)

    Chansin, Guillaume A T; Hong, Jongin; Dusting, Jonathan; deMello, Andrew J; Albrecht, Tim; Edel, Joshua B

    2011-10-04

    Electron beam-induced shrinkage provides a convenient way of resizing solid-state nanopores in Si(3) N(4) membranes. Here, a scanning electron microscope (SEM) has been used to resize a range of different focussed ion beam-milled nanopores in Al-coated Si(3) N(4) membranes. Energy-dispersive X-ray spectra and SEM images acquired during resizing highlight that a time-variant carbon deposition process is the dominant mechanism of pore shrinkage, although granular structures on the membrane surface in the vicinity of the pores suggest that competing processes may occur. Shrinkage is observed on the Al side of the pore as well as on the Si(3) N(4) side, while the shrinkage rate is observed to be dependent on a variety of factors. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  3. Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Mark Schulz

    2011-08-01

    Full Text Available Nanothread with a diameter as small as one hundred nanometers was manufactured under a scanning electron microscope. Made directly from carbon nanotubes, and inheriting their superior electrical and mechanical properties, nanothread may be the world’s smallest man-made fiber. The smallest thread that can be spun using a bench-top spinning machine is about 5 microns in diameter. Nanothread is a new material building block that can be used at the nanoscale or plied to form yarn for applications at the micro and macro scales. Preliminary electrical and mechanical properties of nanothread were measured. The resistivity of nanothread is less than 10−5 Ω∙m. The strength of nanothread is greater than 0.5 GPa. This strength was obtained from measurements using special glue that cures in an electron microscope. The glue weakened the thread, thus further work is needed to obtain more accurate measurements. Nanothread will have broad applications in enabling electrical components, circuits, sensors, and tiny machines. Yarn can be used for various macroscale applications including lightweight antennas, composites, and cables.

  4. Scanning electron microscope autoradiography of critical point dried biological samples

    International Nuclear Information System (INIS)

    Weiss, R.L.

    1980-01-01

    A technique has been developed for the localization of isotopes in the scanning electron microscope. Autoradiographic studies have been performed using a model system and a unicellular biflagellate alga. One requirement of this technique is that all manipulations be carried out on samples that are maintained in a liquid state. Observations of a source of radiation ( 125 I-ferritin) show that the nuclear emulsion used to detect radiation is active under these conditions. Efficiency measurement performed using 125 I-ferritin indicate that 125 I-SEM autoradiography is an efficient process that exhibits a 'dose dependent' response. Two types of labeling methods were used with cells, surface labeling with 125 I and internal labeling with 3 H. Silver grains appeared on labeled cells after autoradiography, removal of residual gelatin and critical point drying. The location of grains was examined on a flagellated green alga (Chlamydomonas reinhardi) capable of undergoing cell fusion. Fusion experiments using labeled and unlabeled cells indicate that 1. Labeling is specific for incorporated radioactivity; 2. Cell surface structure is preserved in SEM autoradiographs and 3. The technique appears to produce reliable autoradiographs. Thus scanning electron microscope autoradiography should provide a new and useful experimental approach

  5. Development of a secondary electron energy analyzer for a transmission electron microscope.

    Science.gov (United States)

    Magara, Hideyuki; Tomita, Takeshi; Kondo, Yukihito; Sato, Takafumi; Akase, Zentaro; Shindo, Daisuke

    2018-04-01

    A secondary electron (SE) energy analyzer was developed for a transmission electron microscope. The analyzer comprises a microchannel plate (MCP) for detecting electrons, a coil for collecting SEs emitted from the specimen, a tube for reducing the number of backscattered electrons incident on the MCP, and a retarding mesh for selecting the energy of SEs incident on the MCP. The detection of the SEs associated with charging phenomena around a charged specimen was attempted by performing electron holography and SE spectroscopy using the energy analyzer. The results suggest that it is possible to obtain the energy spectra of SEs using the analyzer and the charging states of a specimen by electron holography simultaneously.

  6. Electronic structure of the dilute magnetic semiconductor G a1 -xM nxP from hard x-ray photoelectron spectroscopy and angle-resolved photoemission

    Science.gov (United States)

    Keqi, A.; Gehlmann, M.; Conti, G.; Nemšák, S.; Rattanachata, A.; Minár, J.; Plucinski, L.; Rault, J. E.; Rueff, J. P.; Scarpulla, M.; Hategan, M.; Pálsson, G. K.; Conlon, C.; Eiteneer, D.; Saw, A. Y.; Gray, A. X.; Kobayashi, K.; Ueda, S.; Dubon, O. D.; Schneider, C. M.; Fadley, C. S.

    2018-04-01

    We have investigated the electronic structure of the dilute magnetic semiconductor (DMS) G a0.98M n0.02P and compared it to that of an undoped GaP reference sample, using hard x-ray photoelectron spectroscopy (HXPS) and hard x-ray angle-resolved photoemission spectroscopy (HARPES) at energies of about 3 keV. We present experimental data, as well as theoretical calculations, to understand the role of the Mn dopant in the emergence of ferromagnetism in this material. Both core-level spectra and angle-resolved or angle-integrated valence spectra are discussed. In particular, the HARPES experimental data are compared to free-electron final-state model calculations and to more accurate one-step photoemission theory. The experimental results show differences between G a0.98M n0.02P and GaP in both angle-resolved and angle-integrated valence spectra. The G a0.98M n0.02P bands are broadened due to the presence of Mn impurities that disturb the long-range translational order of the host GaP crystal. Mn-induced changes of the electronic structure are observed over the entire valence band range, including the presence of a distinct impurity band close to the valence-band maximum of the DMS. These experimental results are in good agreement with the one-step photoemission calculations and a prior HARPES study of G a0.97M n0.03As and GaAs [Gray et al., Nat. Mater. 11, 957 (2012), 10.1038/nmat3450], demonstrating the strong similarity between these two materials. The Mn 2 p and 3 s core-level spectra also reveal an essentially identical state in doping both GaAs and GaP.

  7. Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

    Science.gov (United States)

    Gaskin, Jessica; Abbott, Terry; Medley, Stephanie; Gregory, Don; Thaisen, Kevin; Taylor , Lawrence; Ramsey, Brian; Jerman, Gregory; Sampson, Allen; Harvey, Ralph

    2010-01-01

    The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

  8. Simulation and Characterization of a Miniaturized Scanning Electron Microscope

    Science.gov (United States)

    Gaskin, Jessica A.; Jerman, Gregory A.; Medley, Stephanie; Gregory, Don; Abbott, Terry O.; Sampson, Allen R.

    2011-01-01

    A miniaturized Scanning Electron Microscope (mSEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), the University of Tennessee in Knoxville (UTK) and Case Western Reserve University (CWRU). This effort focuses on the characterization of individual components of the mSEM and simulation of the complete system. SEMs can provide information on the size, shape, morphology and chemical composition of lunar regolith. Understanding these basic properties will allow us to better estimate the challenges associated with In-Situ Resource Utilization and to improve our basic science knowledge of the lunar surface (either precluding the need for sample return or allowing differentiation of unique samples to be returned to Earth.) The main components of the mSEM prototype includes: a cold field emission electron gun (CFEG), focusing lens, deflection/scanning system and backscatter electron detector. Of these, the electron gun development is of particular importance as it dictates much of the design of the remaining components. A CFEG was chosen for use with the lunar mSEM as its emission does not depend on heating of the tungsten emitter (lower power), it offers a long operation lifetime, is orders of magnitude brighter than tungsten hairpin guns, has a small source size and exhibits low beam energy spread.

  9. Field Emission Scanning Electron Microscope (FESEM) Facility in BTI

    International Nuclear Information System (INIS)

    Cik Rohaida Che Hak; Foo, C.T.; Nor Azillah Fatimah Othman

    2015-01-01

    Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. The GeminisSEM 500, a new FESEM imaging facility will be installed soon in MTEC, BTI. It provides resolution of the images is as low as 0.6 nm at 15 kV and 1.2 nm at 1 kV, allowing examination of the top surface of nano powders, nano film and nano fiber in the wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences. This system is equipped with several detectors to detect various signals such as secondary electrons (SE) detector for topographic information and back-scattered electrons (BSE) detector for materials composition contrast. Energy dispersive x-ray spectroscopy (EDS) with detector energy resolution of < 129 eV and detection limit in the range of 1000-3000 ppm coupled with FE-SEM is used to determine the chemical composition of micro-features including boron (B) to uranium (U). Wavelength dispersive x-ray spectroscopy (WDS) which has detector resolution of 2-20 eV and detection limit of 30-300 ppm coupled with FE-SEM is used to detect elements that cannot be resolved with EDS. The ultra-high resolution imaging combined with the high sensitivity WDS helps to resolve the thorium and rare earth elemental analysis. (author)

  10. Synchronization and Characterization of an Ultra-Short Laser for Photoemission and Electron-Beam Diagnostics Studies at a Radio Frequency Photoinjector

    Energy Technology Data Exchange (ETDEWEB)

    Maxwell, Timothy; Ruan, Jinhao; Piot, Philippe; Lumpkin, Alex

    2012-03-01

    A commercially-available titanium-sapphire laser system has recently been installed at the Fermilab A0 photoinjector laboratory in support of photoemission and electron beam diagnostics studies. The laser system is synchronized to both the 1.3-GHz master oscillator and a 1-Hz signal use to trigger the radiofrequency system and instrumentation acquisition. The synchronization scheme and performance are detailed. Long-term temporal and intensity drifts are identified and actively suppressed to within 1 ps and 1.5%, respectively. Measurement and optimization of the laser's temporal profile are accomplished using frequency-resolved optical gating.

  11. Microstructure of steel X 20 Cr 13 in the electron microscopical picture

    International Nuclear Information System (INIS)

    Gesatzke, W.

    1982-01-01

    The tempered microstructure of the steel X 20 Cr 13 is described by an electron microscopical overall picture and additional information is gained which would not be possible with the optical microscope. The large transmission area permits one to quantitatively evaluate a microstructure component which due to its small size can only be measured with electron microscope pictures. (orig.) [de

  12. Large area fabrication of plasmonic nanoparticle grating structure by conventional scanning electron microscope

    International Nuclear Information System (INIS)

    Sudheer,; Tiwari, P.; Rai, V. N.; Srivastava, A. K.; Mukharjee, C.

    2015-01-01

    Plasmonic nanoparticle grating (PNG) structure of different periods has been fabricated by electron beam lithography using silver halide based transmission electron microscope film as a substrate. Conventional scanning electron microscope is used as a fabrication tool for electron beam lithography. Optical microscope and energy dispersive spectroscopy (EDS) have been used for its morphological and elemental characterization. Optical characterization is performed by UV-Vis absorption spectroscopic technique

  13. Permanent magnet finger-size scanning electron microscope columns

    Energy Technology Data Exchange (ETDEWEB)

    Nelliyan, K., E-mail: elenk@nus.edu.sg [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore); Khursheed, A. [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore)

    2011-07-21

    This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

  14. Electron-microscope study of cloud and fog nuclei

    Energy Technology Data Exchange (ETDEWEB)

    Ogiwara, S; Okita, T

    1952-01-01

    Droplets of clouds on a mountain and of fog in an urban area were captured and the form, nature and size of their nuclei were studied by means of an electron-microscope and by a chamber of constant humidity. These nuclei have similar form and nature to the hygroscopic particles in haze and to the artificially produced combustion particles. No sea-salt nuclei were found in our observations, therefore, sea-spray appears to be an insignificant source of condensation nuclei. It was found that both the cloud and the fog nuclei originated in combustion products which were the mixture of hygroscopic and non-hygroscopic substances, and that the greater part of the nuclei did not contain pure sulfuric acid.

  15. Pigmentosis tubae, a new entity: light and electron microscopic study

    International Nuclear Information System (INIS)

    Herrera, G.A.; Reimann, B.E.; Greenberg, H.L.; Miles, P.A.

    1983-01-01

    The authors noted an unusual finding in the fallopian tubes of a 31-year-old woman who had received external and internal whole pelvis radiotherapy for squamous cell carcinoma of the cervix. Aggregates of macrophages containing pigment, identified in a subepithelial location, were reminiscent of melanosis coli, which is caused by abuse of anthracene-containing laxatives. Electron microscopic examination of the pigment revealed cytoplasmic material with the appearance of lipofuscin, identical to the pigment described in cases of colonic melanosis. After a careful study of possible etiologic agents, it was concluded that the pigment most likely resulted from cellular damage caused by radiotherapy. The authors are not aware of any other reported case of this entity, which will be called pigmentosis tubae

  16. Permanent magnet finger-size scanning electron microscope columns

    International Nuclear Information System (INIS)

    Nelliyan, K.; Khursheed, A.

    2011-01-01

    This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

  17. Trichomes of Cannabis sativa as viewed with scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ledbetter, M C; Krikorian, A D

    1975-06-01

    Direct examination of fresh, unfixed and uncoated specimens from vegetative and floral parts of Cannabis sativa with the scanning electron microscope enables one to obtain a faithful representation of their surface morphology. The presence of two major types of trichomes has been confirmed: a glandular type comprising or terminating in a globoid structure, and a conically-shaped nonglandular type. Moreover, three or possibly four distinct glandular types can be distinguished: sessile globoid, small-stalked and large-stalked globoid, and a peltate type. The nonglandular trichomes can be distinguished by the nature of their surfaces: those with a warty surface, and those which are relatively smooth. The range of size and distribution, and the special features of all these types of trichomes are also provided.

  18. Mucopolysaccharides in the trabecular meshwork. Light and electron microscopic autoradiography

    Energy Technology Data Exchange (ETDEWEB)

    Ohnishi, Yoshitaka; Yamana, Yasuo; Abe, Masahiro (Kyushu Univ., Fukuoka (Japan). Faculty of Medicine)

    1982-09-01

    The localization of /sup 35/S-sulfate and /sup 3/H-glucosamine in the trabecular region of the hamster was studied by light and electron microscopic autoradiography after the intraperitoneal injection. Exposed silver grains of /sup 35/S-sulfate were concentrated in the trabecular meshwork, sclera and cornea, and grains of /sup 35/H-glucosamine were localized in the trabecular region. The radioactivity of both isotopes was observed in the Golgi apparatuses of the endothelial cells and fibroblasts in Schlemm's canal and the trabecular meshwork. Thereafter, the grains were noted over the entire cytoplasm, except for the nucleus, and then were incorporated into the amorphous substance and collagen fibers in the juxtacanalicular connective tissue. These results suggest that endothelial cells in the trabecular region synthesize and secrete the sulfated mucopolysaccharides and hyaluronic acid.

  19. Electron microscopic study on SrGdMnO4

    International Nuclear Information System (INIS)

    Nakano, Hiromi; Ishizawa, Nobuo; Kamegashira, Naoki; Zulhadjri; Shishido, Toetsu

    2006-01-01

    Single crystals of SrGdMnO 4 have been synthesized by the floating zone method. The structure was characterized as the K 2 NiF 4 -type, using X-ray diffraction (XRD) and a transmission electron microscope (TEM). Presence of weak reflections breaking the archetypal tetragonal symmetry was observed from the selected area diffraction (SAD). The compound was found to have an orthorhombic unit cell of a ≅ b = 0.532(4) nm, c = 1.271(6) nm, by taking the a and b axes along the diagonal directions on the basal plane of the tetragonal archetype. Structural change occurred around 1018 K. The weak reflections disappeared in the SAD pattern, suggesting that crystal is of the archetype above 1018 K

  20. Transmission electron microscope sample holder with optical features

    Science.gov (United States)

    Milas, Mirko [Port Jefferson, NY; Zhu, Yimei [Stony Brook, NY; Rameau, Jonathan David [Coram, NY

    2012-03-27

    A sample holder for holding a sample to be observed for research purposes, particularly in a transmission electron microscope (TEM), generally includes an external alignment part for directing a light beam in a predetermined beam direction, a sample holder body in optical communication with the external alignment part and a sample support member disposed at a distal end of the sample holder body opposite the external alignment part for holding a sample to be analyzed. The sample holder body defines an internal conduit for the light beam and the sample support member includes a light beam positioner for directing the light beam between the sample holder body and the sample held by the sample support member.

  1. In situ ion etching in a scanning electron microscope

    International Nuclear Information System (INIS)

    Dhariwal, R.S.; Fitch, R.K.

    1977-01-01

    A facility for ion etching in a scanning electron microscope is described which incorporates a new type of electrostatic ion source and viewing of the specimen is possible within about 30 sec after terminating the ion bombardment. Artefacts produced during etching have been studied and cone formation has been followed during its growth. The instrument has provided useful structural information on metals, alloys, and sinters. However, although insulating materials, such as plastics, glass and resins, have been successfully etched, interpretation of the resultant micrographs is more difficult. Ion etching of soft biological tissues, such as the rat duodenum was found to be of considerable interest. The observed structural features arise from the selective intake of the heavy fixation elements by different parts of the tissue. Hard biological materials, such as dental tissues and restorative materials, have also been studied and the prismatic structure of the enamel and the form and distribution of the dentinal tubules have been revealed. (author)

  2. A scanning electron microscopic investigation of ceramic orthodontic brackets

    International Nuclear Information System (INIS)

    McDonald, F.; Toms, A.P.

    1990-01-01

    Ceramic brackets were introduced to overcome the esthetic disadvantages of stainless steel brackets. The clinical impression of these brackets is very favorable. However, the sliding mechanics used in the Straightwire (A Company, San Diego, CA, USA) system appear to produce slower tooth movements with ceramic compared to stainless steel brackets. To determine whether this was due to any obvious mechanical problem in the bracket slot, Transcend (Unitek Corporation/3M, Monrovia, CA, USA) ceramic brackets were examined by a scanning electron microscope and compared to stainless steel brackets.Consistently, large surface defects were found in the ceramic bracket slots that were not present in the metal bracket slots. These irregularities could obviously hinder the sliding mechanics of the bracket slot-archwire system and create a greater demand on anchorage. Conversely, the fitting surface of the Transcend ceramic bracket showed extremely smooth surface characteristics, and it would seem advisable for the manufacturers to incorporate this surface within the bracket slot. (author)

  3. Characterization of polycapillary optics installed in an analytical electron microscope

    International Nuclear Information System (INIS)

    Takano, Akira; Maehata, Keisuke; Iyomoto, Naoko; Hara, Toru; Mitsuda, Kazuhisa; Yamasaki, Noriko; Tanaka, Keiichi

    2016-01-01

    An energy-dispersive spectrometer with a superconducting transition edge sensor (TES) microcalorimeter mounted on a scanning transmission electron microscope (STEM) is developed to enhance the accuracy of nanoscale materials analysis. TES microcalorimeters generally have sensitive surface areas of the order of 100 × 100 µm 2 . Also, the magnetic field generated by the STEM objective lens means that a TES microcalorimeter cannot be placed in a STEM column. We therefore use polycapillary optics to collect the X-rays. In this study, X-rays are collected from a STEM specimen and are then focused on a silicon drift detector; from these measurements, the optics are characterized and the experimental results are compared with the design of the optics. (author)

  4. Quantitative electron microscopical autoradiography of calcium during dentinogenesis

    Energy Technology Data Exchange (ETDEWEB)

    Nagai, Y [Tokyo Dental Coll. (Japan); Frank, R M

    1975-03-01

    /sup 45/Ca migration from the dental papilla and the odontablasts towards predentin and dentin has been studied through electron microscopical autoradiography in toothgerms of newborn cats. A quantitative procedure was applied to the study of the /sup 45/Ca migration in dentinogenesis. Two pathways of almost identical importance have been demonstrated. The direct pathway followed the intercellular spaces of the dental papilla and of the odontoblasts and reached the dentin via predentin. The second road, after passage through the intercellular spaces of the dental papilla, consisted of an intracellular migration through the odontoblast. The mitochondria and the golgi apparatus were progressively the most labelet at 5 min., 30 min. and 1 h. after intravenous injection. The calcium diffused into the odontablastic process without being associated with the dense granule. At 6 hours, maximum radioactivity was observed in the intertubular dentin.

  5. Quantitative electron microscopical autoradiography of calcium during amelogenesis

    International Nuclear Information System (INIS)

    Nagai, Yoshinori; Frank, R.M.

    1975-01-01

    The migration of 45 Ca through the stratum intermedium and through the secreting ameloblasts towards enamel has been studied by electron microscopical autoradiography in the toothgerms of newborn cats. A quantitative procedure was applied to the study of the 45 Ca migration in amelogenesis and two pathways were demonstrated. The relatively more important direct route passed through the stratum intermedium and the ameloblast intercellular spaces and reached the enamel directly. The second pathway consisted of an intracellular migration through the ameloblast. 45 Ca penetrated the cell through its basal pole. The mitochondrias were the most highly labeled organelles at the different experimental time intervals studied. A total absence of silver grains was noted over the secretory ameloblastic bodies. At 6 hours, the highest labeling was observed over enamel. (auth.)

  6. Fabrication and electric measurements of nanostructures inside transmission electron microscope

    International Nuclear Information System (INIS)

    Chen, Qing; Peng, Lian-Mao

    2011-01-01

    Using manipulation holders specially designed for transmission electron microscope (TEM), nanostructures can be characterized, measured, modified and even fabricated in-situ. In-situ TEM techniques not only enable real-time study of structure-property relationships of materials at atomic scale, but also provide the ability to control and manipulate materials and structures at nanoscale. This review highlights in-situ electric measurements and in-situ fabrication and structure modification using manipulation holder inside TEM. -- Research highlights: → We review in-situ works using manipulation holder in TEM. → In-situ electric measurements, fabrication and structure modification are focused. → We discuss important issues that should be considered for reliable results. → In-situ TEM is becoming a very powerful tool for many research fields.

  7. Contained scanning electron microscope facility for examining radioactive materials

    International Nuclear Information System (INIS)

    Hsu, C.W.

    1986-03-01

    At the Savannah River Laboratory (SRL) radioactive solids are characterized with a scanning electron microscope (SEM) contained in a glove box. The system includes a research-grade Cambridge S-250 SEM, a Tracor Northern TN-5500 x-ray and image analyzer, and a Microspec wavelength-dispersive x-ray analyzer. The containment facility has a glove box train for mounting and coating samples, and for housing the SEM column, x-ray detectors, and vacuum pumps. The control consoles of the instruments are located outside the glove boxes. This facility has been actively used since October 1983 for high alpha-activity materials such as plutonium metal and plutonium oxide powders. Radioactive defense waste glasses and contaminated equipment have also been examined. During this period the facility had no safety-related incidents, and personnel radiation exposures were maintained at less than 100 mrems

  8. Structural Fingerprinting of Nanocrystals in the Transmission Electron Microscope

    Science.gov (United States)

    Rouvimov, Sergei; Plachinda, Pavel; Moeck, Peter

    2010-03-01

    Three novel strategies for the structurally identification of nanocrystals in a transmission electron microscope are presented. Either a single high-resolution transmission electron microscopy image [1] or a single precession electron diffractogram (PED) [2] may be employed. PEDs from fine-grained crystal powders may also be utilized. Automation of the former two strategies is in progress and shall lead to statistically significant results on ensembles of nanocrystals. Open-access databases such as the Crystallography Open Database which provides more than 81,500 crystal structure data sets [3] or its mainly inorganic and educational subsets [4] may be utilized. [1] http://www.scientificjournals.org/journals 2007/j/of/dissertation.htm [2] P. Moeck and S. Rouvimov, in: {Drugs and the Pharmaceutical Sciences}, Vol. 191, 2009, 270-313 [3] http://cod.ibt.lt, http://www.crystallography.net, http://cod.ensicaen.fr, http://nanocrystallography.org, http://nanocrystallography.net, http://journals.iucr.org/j/issues/2009/04/00/kk5039/kk5039.pdf [4] http://nanocrystallography.research.pdx.edu/CIF-searchable

  9. Electron beam excitation assisted optical microscope with ultra-high resolution.

    Science.gov (United States)

    Inami, Wataru; Nakajima, Kentaro; Miyakawa, Atsuo; Kawata, Yoshimasa

    2010-06-07

    We propose electron beam excitation assisted optical microscope, and demonstrated its resolution higher than 50 nm. In the microscope, a light source in a few nanometers size is excited by focused electron beam in a luminescent film. The microscope makes it possible to observe dynamic behavior of living biological specimens in various surroundings, such as air or liquids. Scan speed of the nanometric light source is faster than that in conventional near-field scanning optical microscopes. The microscope enables to observe optical constants such as absorption, refractive index, polarization, and their dynamic behavior on a nanometric scale. The microscope opens new microscopy applications in nano-technology and nano-science.

  10. Electronic properties of Nd2−xCexCuO4+δ: A hard X-ray photoemission investigation

    International Nuclear Information System (INIS)

    Guarino, A.; Panaccione, G.; Offi, F.; Monaco, G.; Fondacaro, A.; Torelli, P.; Fittipaldi, R.; Vecchione, A.; Pace, S.; Nigro, A.

    2016-01-01

    Highlights: • We grow and characterize Nd 2−x Ce x CuO 4+δ samples as thin film and single crystal. • We study the Cu 2p levels of our samples by hard X-ray photoemission spectroscopy. • We investigate bulk features of the Nd 2−x Ce x CuO 4+δ samples. • Signature of the bulk response is correlated with the crystallinity of the samples. - Abstract: Cu 2p core levels spectra measured by X-ray photoemission spectroscopy of selected as-grown Nd 2−x Ce x CuO 4+δ samples are presented and discussed. The presence of a satellite peak in the 2p core level of Nd 2−x Ce x CuO 4+δ single crystal by hard X-ray photoemission is confirmed in all non-superconducting samples, films and single crystals investigated in this work. The comparison of the spectral features of the different samples suggests that the presence and the intensity of this satellite peak is not related to the electric transport properties, but to the texture characteristics.

  11. Visualization of atomic distances at the 1MV electron microscope: first results obtained on the Grenoble 1MV microscope

    International Nuclear Information System (INIS)

    Bourret, A.

    1975-01-01

    Practical and theoretical conditions for obtaining high resolution lattice images are presented. The use of a high voltage electron microscope is particularly powerful to visualize distances smaller than 3A. A 2A resolution test on (200) gold planes has been carried out on the Grenoble 1MV microscope. It would be possible at this level to study the crystalline defects such as dislocations or grain boundaries [fr

  12. Field electron emission spectrometer combined with field ion/electron microscope as a field emission laboratory

    International Nuclear Information System (INIS)

    Shkuratov, S.I.; Ivanov, S.N.; Shilimanov, S.N.

    1996-01-01

    The facility, combining the field ion microscope, field electron emission microscope and field electron emission spectrometer, is described. Combination of three methodologies makes it possible to carry out the complete cycle of emission studies. Atom-plane and clean surface of the studied samples is prepared by means of field evaporation of the material atom layers without any thermal and radiation impact. This enables the study of atom and electron structure of clean surface of the wide range materials, the study whereof through the field emission methods was previously rather difficult. The temperature of the samples under study changes from 75 up to 2500 K. The energy resolution of the electron analyzer equals 30 MeV. 19 refs., 10 figs

  13. Ultra low-K shrinkage behavior when under electron beam in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Lorut, F.; Imbert, G. [ST Microelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex (France); Roggero, A. [Centre National d' Etudes Spatiales, 18 Avenue Edouard Belin, 31400 Toulouse (France)

    2013-08-28

    In this paper, we investigate the tendency of porous low-K dielectrics (also named Ultra Low-K, ULK) behavior to shrink when exposed to the electron beam of a scanning electron microscope. Various experimental electron beam conditions have been used for irradiating ULK thin films, and the resulting shrinkage has been measured through use of an atomic force microscope tool. We report the shrinkage to be a fast, cumulative, and dose dependent effect. Correlation of the shrinkage with incident electron beam energy loss has also been evidenced. The chemical modification of the ULK films within the interaction volume has been demonstrated, with a densification of the layer and a loss of carbon and hydrogen elements being observed.

  14. Investigation of electronic states of infinite-layer SrFeO2 epitaxial thin films by X-ray photoemission and absorption spectroscopies

    International Nuclear Information System (INIS)

    Chikamatsu, Akira; Matsuyama, Toshiya; Hirose, Yasushi; Kumigashira, Hiroshi; Oshima, Masaharu; Hasegawa, Tetsuya

    2012-01-01

    Highlights: ► Electronic states of infinite-layer SrFeO 2 films have been experimentally observed. ► Fe 3d states have higher densities of states in the valence-band region. ► Three peaks derived from Fe 3d states were observed in the conduction-band region. ► Indirect bandgap value was determined to be 1.3 eV. - Abstract: We investigated the electronic states of a single-crystal SrFeO 2 epitaxial thin film in the valence-band and conduction-band regions using synchrotron-radiation X-ray photoemission and absorption spectroscopies. Fe 2p–3d resonant photoemission measurements revealed that the Fe 3d states have higher densities of states at binding energies of 3–5 eV and 5–8.5 eV in the valence-band region. The O K-edge X-ray absorption spectrum exhibited three peaks in the Fe 3d-derived conduction band hybridized with O 2p states; these can be assigned to Fe 3d xy , 3d xz + 3d yz , and 3d x 2 –y 2 . In addition, the indirect bandgap value of the SrFeO 2 film was determined to be 1.3 eV by transmission and absorption spectroscopies.

  15. Cathodoluminescence of semiconductors in the scanning electron microscope

    International Nuclear Information System (INIS)

    Noriegas, Javier Piqueras de

    2008-01-01

    Full text: Cathodoluminescence (CL) in the scanning electron microscope (SEM) is a nondestructive technique, useful for characterization of optical and electronic properties of semiconductors, with spatial resolution. The contrast in the images of CL is related to the presence of crystalline defects, precipitates or impurities and provides information on their spatial distribution. CL spectra allows to study local energy position of localized electronic states. The application of the CL is extended to semiconductor very different characteristics, such as bulk material, heterostructures, nanocrystalline film, porous semiconductor, nanocrystals, nanowires and other nano-and microstructures. In the case of wafers, provides information on the homogeneity of their electronic characteristics, density of dislocations, grain sub frontiers, distribution of impurities and so on. while on the study of heterostructures CL images can determine, for example, the presence of misfit dislocations at the interface between different sheets, below the outer surface of the sample. In the study of other low dimensional structures, such as nanocrystalline films, nanoparticles and nano-and microstructures are observed elongated in some cases quantum confinement effects from the CL spectra. Moreover, larger structures, the order of hundreds of nanometers, with forms of wires, tubes or strips, is that in many semiconductor materials, mainly oxides, the behavior of luminescence is different from bulk material. The microstructures have a different structure of defects and a greater influence of the surface, which in some cases leads to a higher emission efficiency and a different spectral distribution. The presentation describes the principle of the CL technique and examples of its application in the characterization of a wide range of both semiconductor materials of different composition, and of different sizes ranging from nanostructures to bulk samples

  16. Optimization of the laser-induced photoemission for the production of polarized electron beams at the 50-keV source of the Bonn accelerator facility ELSA

    International Nuclear Information System (INIS)

    Gowin, M.

    2001-10-01

    Medium energy experiments requiring circularly polarized photons (produced by Bremsstrahlung of longitudinally polarized electrons) have started at the electron stretcher ELSA in Bonn. To fulfill the demands of the experiment (GDH) the laser induced photoemission of the 50 keV electron source has been optimized. Systematic studies with a titan-sapphire laser to optimize the pulse structure of the laser pulse and the emitted spectral width has been done. Using a Be-InGaAs/Be-AlGaAs strained superlattice photocathode a beam polarization of 80% with a quantum efficiency of 0.4% has been obtained while producing a space charge limited 100 mA beam current. (orig.)

  17. Electron microscope investigation into dislocation structure of cast aluminium alloys

    International Nuclear Information System (INIS)

    Zolotorevskij, V.S.; Orelkina, T.A.; Istomin-Kastrovskij, V.V.

    1978-01-01

    By applying the diffraction electron microscopy method, the general specific features of the disclocation structure of cast binary alloys of aluminium with different additions were established. It is shown that in most alloys, when they undergo cooling in the process of crystallization at the rate of about 850 deg/min, the cellular dislocation structure is formed. It is shown that in all the alloys studied, the total density of dislocations of one order is about-10 9 cm -2 , which exceeds by 1 to 2 orders of magnitude the value which follows from the Tiller theory of concentration stresses. It has been experimentally established that the contribution of shrinkage and thermal stresses to the formation of a dislocation structure is rather insignificant; yet the dislocation density values calculated according to the size of dendritic cells and the medium angles of their disorientation are close to those determined by the electron-microscopic method. This is the basis for making a supposition that the greater part of the dislocations in castings are formed as a result of comparing dendritic branches with one another, which are disoriented in respect to each other

  18. Photoemission studies of mixed valent systems

    International Nuclear Information System (INIS)

    Parks, R.D.; Raaen, S.; denBoer, M.L.; Williams, G.P.

    1984-01-01

    Photoemission spectroscopy has been used to study a number of aspects of the mixed valent state (corresponding to non-integral 4f occupation) in rare earth systems. Deep core photoemission (e.g., from 3d or 4d levels) allows the measurement of the 4f occupancy and surface valence shifts, and, as well, the indirect measurement of the effect of solid state environment on the energy of hybridization between 4f electrons and conduction electrons. 4f-Derived photoemission has been used to study surface valance and chemical shifts and to infer the nature of the mixed valent ground state. A combination of 4f-derived photoemission and add-electron spectroscopy provides a measurement of the rf Coulomb correlation energy, an important parameter in the mixed valent problem. A review of these approaches will be presented, with emphasis on Ce-based systems, whose behavior falls outside the usual description of 4f-unstable systems

  19. Advances in imaging and electron physics the scanning transmission electron microscope

    CERN Document Server

    Hawkes, Peter W

    2009-01-01

    Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians.

  20. Interaction of electrons with light metal hydrides in the transmission electron microscope.

    Science.gov (United States)

    Wang, Yongming; Wakasugi, Takenobu; Isobe, Shigehito; Hashimoto, Naoyuki; Ohnuki, Somei

    2014-12-01

    Transmission electron microscope (TEM) observation of light metal hydrides is complicated by the instability of these materials under electron irradiation. In this study, the electron kinetic energy dependences of the interactions of incident electrons with lithium, sodium and magnesium hydrides, as well as the constituting element effect on the interactions, were theoretically discussed, and electron irradiation damage to these hydrides was examined using in situ TEM. The results indicate that high incident electron kinetic energy helps alleviate the irradiation damage resulting from inelastic or elastic scattering of the incident electrons in the TEM. Therefore, observations and characterizations of these materials would benefit from increased, instead decreased, TEM operating voltage. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  1. Collaborative Research and Development. Delivery Order 0006: Transmission Electron Microscope Image Modeling and Semiconductor Heterointerface Characterization

    National Research Council Canada - National Science Library

    Mahalingam, Krishnamurthy

    2006-01-01

    .... Transmission electron microscope (TEM) characterization studies were performed on a variety of novel III-V semiconductor heterostructures being developed for advanced optoelectronic device applications...

  2. Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion

    International Nuclear Information System (INIS)

    Svensson, K.; Jompol, Y.; Olin, H.; Olsson, E.

    2003-01-01

    A scanning tunneling microscope (STM) with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope (TEM), while maintaining atomic scale resolution in both STM and TEM imaging

  3. Electron sputtering in the analytical electron microscope: Calculations and experimental data

    International Nuclear Information System (INIS)

    Zaluzec, N.J.; Mansfield, J.F.

    1987-03-01

    The environment of the electron microscope is particularly severe when one considers the energy deposited in a specimen during typical experimental conditions. Conventional imaging experiments tend to employ electron current densities ranging from ∼0.1 to 1 A/cm 2 while during microanalysis conditions probe current densities can range from 10 to values as high as 10 5 A/cm 2 . At 100 kV this corresponds to power densities from 100 Kilowatts/cm 2 to 10 4 Megawatts/cm 2 . These energy deposition rates can result in electron irradiation damage which can substantially alter the structure and composition of a specimen through either ionization damage in organics or by displacement damage in inorganics and/or combinations thereof. For the most part materials scientists operating an analytical electron microscope (AEM) in the 100 to 200 kV regime studying metallic and/or ceramic specimens have been spared the need to consider either of these effects as their specimens have tended to be sufficiently resilient. However, the advent of the new medium voltage microscopes operating in the 300 to 400 kV regime with high brightness guns and clean or ultrahigh vacuum systems has necessitated a reevaluation of the effects of higher voltage operation in light of the destructive nature of the electron beam particularly under microanalysis conditions

  4. Microscopic appearance analysis of raw material used for the production of sintered UO2 by scanning electron microscope

    International Nuclear Information System (INIS)

    Liu feiming

    1992-01-01

    The paper describes the microscopic appearance of UO 2 , U 3 O 8 , ADU and AUC powders used for the production of sintered UO 2 slug of nuclear fuel component of PWR. The characteristic analysis of the microscopic appearance observed by scanning electron microscope shows that the quality and finished product rate of sintered UO 2 depend on the appearance characteristic of the active Uo 2 powder, such as grade size and its distribution, spherulitized extent, surface condition and heap model etc.. The addition of U 3 O 8 to the UO 2 powder improves significantly the quality and the finished product rate. The mechanism of this effect is discussed on the basis of the microscopic appearance characteristic for two kinds of powder

  5. Electron Source Brightness and Illumination Semi-Angle Distribution Measurement in a Transmission Electron Microscope.

    Science.gov (United States)

    Börrnert, Felix; Renner, Julian; Kaiser, Ute

    2018-05-21

    The electron source brightness is an important parameter in an electron microscope. Reliable and easy brightness measurement routes are not easily found. A determination method for the illumination semi-angle distribution in transmission electron microscopy is even less well documented. Herein, we report a simple measurement route for both entities and demonstrate it on a state-of-the-art instrument. The reduced axial brightness of the FEI X-FEG with a monochromator was determined to be larger than 108 A/(m2 sr V).

  6. High-resolution, high-throughput imaging with a multibeam scanning electron microscope.

    Science.gov (United States)

    Eberle, A L; Mikula, S; Schalek, R; Lichtman, J; Knothe Tate, M L; Zeidler, D

    2015-08-01

    Electron-electron interactions and detector bandwidth limit the maximal imaging speed of single-beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed by close to two orders of magnitude and demonstrate imaging for a variety of samples ranging from biological brain tissue to semiconductor wafers. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

  7. Wide-range tunable magnetic lens for tabletop electron microscope

    International Nuclear Information System (INIS)

    Chang, Wei-Yu; Chen, Fu-Rong

    2016-01-01

    A tabletop scanning electron microscope (SEM) utilizes permanent magnets as condenser lenses to minimize its size, but this sacrifices the tunability of condenser lenses such that a tabletop system can only be operated with a fixed accelerating voltage. In contrast, the traditional condenser lens utilizes an electromagnetic coil to adjust the optical properties, but the size of the electromagnetic lens is inevitably larger. Here, we propose a tunable condenser lens for a tabletop SEM that uses a combination of permanent magnets and electromagnetic coils. The overall dimensions of the newly designed lens are the same as the original permanent magnet lens, but the new lens allows the tabletop SEM to be operated at different accelerating voltages between 1 kV and 15 kV. - Highlights: • A compact condenser lens combines both permanent magnet and coils. • A tunable lens is designed to keep the same focal point for voltage 1 to 15 kV. • A miniature tunable lens which can directly fit into tabletop SEM.

  8. Contact detection for nanomanipulation in a scanning electron microscope.

    Science.gov (United States)

    Ru, Changhai; To, Steve

    2012-07-01

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000× magnification while inducing little end-effector damage. Copyright © 2012 Elsevier B.V. All rights reserved.

  9. AIMgSil Alloy Characterization Using Transmission Electron Microscope (TEM)

    International Nuclear Information System (INIS)

    Masrukan; Elman, P.

    1996-01-01

    The aging alloy of AIMgSil containing Mg 2 Si of 1.29 % has been done with the following steps: e.q (a) part of the specimen was heated at 400 o C during 3 hours, and (b) the other part was done with solution treatment at 550 o C followed by quenching. After quenching a part of the specimen was aged at room temperature and other specimen was aged at 160 o C during 16 hours. After the specimen had been heated, then it was shaped into thin foil to be examined by Transmission Electron Microscope. The result showed that the heating at temperature of 400 o C during 3 hours created a second phase (i.e.Mg 2 Si) was like stick shape with the hexagonal structure at [0111] orientation and matrix [001], and the hardness was 31 HB. The aging of specimen at room temperature gave result a GP zone which was like the needles shape in the dislocation area of the face center cubic structure at [111] orientation and [111] matrix. The hardness obtained was 64 HB. In the other hand the aging process at temperature of 160 o C within 16 hours have resulted the precipitate which was greater than that of the former needle shaped as the face center cubic structure without dislocation at matrix with [111] orientation and [114] matrix. The hardness at this condition was 94 HB

  10. Radioactive and electron microscope analysis of effluent monitor sample lines

    International Nuclear Information System (INIS)

    Kowalski, J.F.

    1986-01-01

    Effluent air sampling at nuclear power plant often leads to the question ''How representative is the sample of the effluent stream?'' Samples from radiation monitors are typically obtained at great distances from the sample nozzle because of high background concerns under postulated accidents. Sample line plateout during normal effluent sampling becomes the major concern. A US Nuclear Regulatory Commission inspection raised a concern that monitors were not collecting representative samples per ANSI standard N13.1. A comprehensive 2-yr study at Beaver Valley was performed during normal effluent releases in two phases: 1) weekly charcoal and glass fiber filter samples were analyzed for radioactivity for 6 months, and 2) nuclepore membrane filter samples were analyzed by electron microscope for 4- and 6-h periods. A specially designed test nozzle was directly inserted into an effluent stream for comparison with the radiation monitor samples. Particle behavior characteristics can be determined during effluent releases using a simple test probe. While particle plateout was the major purpose of the study, other particle behavior characteristics were evident and equally as important. Particle travel through long sample lines can also lead to (a) agglomeration or the coagulation of smaller particles to form larger ones, (b) particle splitting or fracturing upon impact with the sample line interior walls, and (c) resuspension of large particles in sample lines

  11. Contact detection for nanomanipulation in a scanning electron microscope

    International Nuclear Information System (INIS)

    Ru, Changhai; To, Steve

    2012-01-01

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000× magnification while inducing little end-effector damage. -- Highlights: ► We presents a simple method for obtaining the depth information in SEM-based nanomanipulation. ► Detecting contact between an end-effector and a target surface using SEM as a vision sensor. ► Additional touch/force sensors or specialized hardware need not be added. ► Achieved high repeatability and accuracy. ► Complete automatic contact detection within typically 60 s.

  12. Wide-range tunable magnetic lens for tabletop electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Chang, Wei-Yu; Chen, Fu-Rong, E-mail: fchen1@me.com

    2016-12-15

    A tabletop scanning electron microscope (SEM) utilizes permanent magnets as condenser lenses to minimize its size, but this sacrifices the tunability of condenser lenses such that a tabletop system can only be operated with a fixed accelerating voltage. In contrast, the traditional condenser lens utilizes an electromagnetic coil to adjust the optical properties, but the size of the electromagnetic lens is inevitably larger. Here, we propose a tunable condenser lens for a tabletop SEM that uses a combination of permanent magnets and electromagnetic coils. The overall dimensions of the newly designed lens are the same as the original permanent magnet lens, but the new lens allows the tabletop SEM to be operated at different accelerating voltages between 1 kV and 15 kV. - Highlights: • A compact condenser lens combines both permanent magnet and coils. • A tunable lens is designed to keep the same focal point for voltage 1 to 15 kV. • A miniature tunable lens which can directly fit into tabletop SEM.

  13. Somatic Embryos in Catharanthus roseus: A Scanning Electron Microscopic Study

    Directory of Open Access Journals (Sweden)

    Junaid ASLAM

    2014-06-01

    Full Text Available Catharanthus roseus (L. G. Don is an important medicinal plant as it contains several anti-cancerous compounds, like vinblastine and vincristine. Plant tissue culture technology (organogenesis and embryogenesis has currently been used in fast mass propagating raw materials for secondary metabolite synthesis. In this present communication, scanning electron microscopic (SEM study of somatic embryos was conducted and discussed. The embryogenic callus was first induced from hypocotyls of in vitro germinated seeds on which somatic embryos, differentiated in numbers, particularly on 2,4-D (1.0 mg/L Murashige and Skoog (MS was medium. To understand more about the regeneration method and in vitro formed embryos SEM was performed. The SEM study revealed normal somatic embryo origin and development from globular to heart-, torpedo- and then into cotyledonary-stage of embryos. At early stage, the embryos were clustered together in a callus mass and could not easily be detached from the parental tissue. The embryos were often long cylindrical structure with or without typical notch at the tip. Secondary embryos were also formed on primary embryo structure. The advanced cotyledonary embryos showed prominent roots and shoot axis, which germinated into plantlets. The morphology, structure and other details of somatic embryos at various stages were presented.

  14. Contact detection for nanomanipulation in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ru, Changhai, E-mail: rchhai@gmail.com [Automation College, Harbin Engineering University, Harbin 150001 (China); Robotics and Microsystems Center, Soochow University, Jiangsu 215021 (China); To, Steve, E-mail: Steve.to@utoronto.ca [Department of Mechanical and Industry Engineering, University of Toronto, Ontario, Canada M5S3G8 (Canada)

    2012-07-15

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000 Multiplication-Sign magnification while inducing little end-effector damage. -- Highlights: Black-Right-Pointing-Pointer We presents a simple method for obtaining the depth information in SEM-based nanomanipulation. Black-Right-Pointing-Pointer Detecting contact between an end-effector and a target surface using SEM as a vision sensor. Black-Right-Pointing-Pointer Additional touch/force sensors or specialized hardware need not be added. Black-Right-Pointing-Pointer Achieved high repeatability and accuracy. Black-Right-Pointing-Pointer Complete automatic contact detection within typically 60 s.

  15. Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode.

    Science.gov (United States)

    Bücker, K; Picher, M; Crégut, O; LaGrange, T; Reed, B W; Park, S T; Masiel, D J; Banhart, F

    2016-12-01

    High temporal resolution transmission electron microscopy techniques have shown significant progress in recent years. Using photoelectron pulses induced by ultrashort laser pulses on the cathode, these methods can probe ultrafast materials processes and have revealed numerous dynamic phenomena at the nanoscale. Most recently, the technique has been implemented in standard thermionic electron microscopes that provide a flexible platform for studying material's dynamics over a wide range of spatial and temporal scales. In this study, the electron pulses in such an ultrafast transmission electron microscope are characterized in detail. The microscope is based on a thermionic gun with a Wehnelt electrode and is operated in a stroboscopic photoelectron mode. It is shown that the Wehnelt bias has a decisive influence on the temporal and energy spread of the picosecond electron pulses. Depending on the shape of the cathode and the cathode-Wehnelt distance, different emission patterns with different pulse parameters are obtained. The energy spread of the pulses is determined by space charge and Boersch effects, given by the number of electrons in a pulse. However, filtering effects due to the chromatic aberrations of the Wehnelt electrode allow the extraction of pulses with narrow energy spreads. The temporal spread is governed by electron trajectories of different length and in different electrostatic potentials. High temporal resolution is obtained by excluding shank emission from the cathode and aberration-induced halos in the emission pattern. By varying the cathode-Wehnelt gap, the Wehnelt bias, and the number of photoelectrons in a pulse, tradeoffs between energy and temporal resolution as well as beam intensity can be made as needed for experiments. Based on the characterization of the electron pulses, the optimal conditions for the operation of ultrafast TEMs with thermionic gun assembly are elaborated. Copyright © 2016 Elsevier B.V. All rights reserved.

  16. Photoemission spectroscopy using synchrotron radiation

    International Nuclear Information System (INIS)

    Kobayashi, K.L.I.

    1980-01-01

    It is an epoch making event for photoemission spectroscopy that the light sources of continuous wavelength from vacuum ultra-violet to X-ray region have become available by the advent of synchrotron radiation. Specifically the progress after stable intense light has become obtainable from storage rings is very significant. One of the features of these synchrotron radiation is its extreme polarization of radiating pattern. Though the elementary processes of photoemission out of solids are the basic themes, phenomenalistic 3-stage model is usually applied to the analysis of experiments. In this model, the process of photoemission is considered by dividing into three stages, namely the generation of photoelectrons due to optical transition between electron status -- the transportation of photoelectrons to solid surfaces -- breaking away from the surfaces. The spectrometers, the energy analyzers of photoelectrons, and sample-preparing room used for photoemission spectroscopy are described. Next, energy distribution curves are explained. At the end, photoelectron yield spectroscopy, CFS (constant final energy spectroscopy) and CIS (constant initial energy spectroscopy), Auger yield and interatomic Auger yield, the determination of surface structure by normal emission CIS, and surface EXAFS (extended X-ray absorption fine structure) are described. As seen above, the application specifically to surface physics is promising in the future. (Wakatsuki, Y.)

  17. Time-resolved two-photon photoemission at the Si(001)-surface. Hot electron dynamics and two-dimensional Fano resonance; Zeitaufgeloeste Zweiphotonen-Photoemission an der Si(001)-Oberflaeche. Dynamik heisser Elektronen und zweidimensionaler Fano-Effekt

    Energy Technology Data Exchange (ETDEWEB)

    Eickhoff, Christian

    2010-10-27

    By combining ultrafast laser excitation with energy-, angle- and time-resolved twophoton photoemission (2PPE), the electronic properties of bulk silicon and the Si(001) surface are investigated in this thesis. A custom-built laser- and UHV-systemequipped with a display type 2D-CCD-detector gives new insight into the relaxation dynamics of excited carriers on a femtosecond timescale. The bandgap between occupied valence bands and unoccupied conduction bands characteristically influences the dynamics of excited electrons in the bulk, as well as in surface states and resonances. For the electron-phonon interaction this leads to the formation of a bottleneck during the relaxation of hot electrons in the conduction band, which maintains the elevated electronic temperature for several picoseconds. During relaxation, excited electrons also scatter from the conduction band into the unoccupied dangling-bond surface state D{sub down}. Depending on the excitation density this surface recombination is dominated by electron-electron- or electron-phonon scattering. The relaxation of the carriers in the D{sub down}-band is again slowed down by the formation of a bottleneck in electron-phonon coupling. Furthermore, the new laser system has allowed detection of the Rydberg-like series of image-potential resonances on the Si(001)-surface. It is shown that the lifetime of these image-potential resonances in front of the semiconducting surface exhibits the same behavior as those in front of metallic surfaces. Moreover the electron-phonon coupling in the first image-potential resonance was investigated and compared to the D{sub down}-surface state. For the first time, Fano-type lineprofiles are demonstrated and analyzed in a 2PPEprocess on a surface. Tuning the photon energy of the pump-laser across the resonance between the occupied dangling-bond state D{sub up}, and the unoccupied image-potential resonance n=1, reveals a clear intensity variation that can be successfully described

  18. Inverse photoemission

    International Nuclear Information System (INIS)

    Namatame, Hirofumi; Taniguchi, Masaki

    1994-01-01

    Photoelectron spectroscopy is regarded as the most powerful means since it can measure almost perfectly the occupied electron state. On the other hand, inverse photoelectron spectroscopy is the technique for measuring unoccupied electron state by using the inverse process of photoelectron spectroscopy, and in principle, the similar experiment to photoelectron spectroscopy becomes feasible. The development of the experimental technology for inverse photoelectron spectroscopy has been carried out energetically by many research groups so far. At present, the heightening of resolution of inverse photoelectron spectroscopy, the development of inverse photoelectron spectroscope in which light energy is variable and so on are carried out. But the inverse photoelectron spectroscope for vacuum ultraviolet region is not on the market. In this report, the principle of inverse photoelectron spectroscopy and the present state of the spectroscope are described, and the direction of the development hereafter is groped. As the experimental equipment, electron guns, light detectors and so on are explained. As the examples of the experiment, the inverse photoelectron spectroscopy of semimagnetic semiconductors and resonance inverse photoelectron spectroscopy are reported. (K.I.)

  19. Bulk electronic structures of n-type superconductor Nd1.85Ce0.15CuO4 probed by high energy angle-resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Tsunekawa, M.; Sekiyama, A.; Kasai, S.; Yamasaki, A.; Fujiwara, H.; Sing, M.; Shigemoto, A.; Imada, S.; Onose, Y.; Tokura, Y.; Muro, T.; Suga, S.

    2005-01-01

    We report on a high-energy angle-resolved photoemission (ARPES) study of the n-type high-T C cuprate, Nd 1.85 Ce 0.15 CuO 4 (NCCO). Our bulk sensitive results suggest a hole-like Fermi surface as seen by the so far reported low-energy ARPES studies. The soft X-ray Cu 2p core-level photoemission spectra show clear polar-angle dependence, suggesting the difference in electron states between the bulk and surface

  20. The sinusoidal lining cells in "normal" human liver. A scanning electron microscopic investigation

    DEFF Research Database (Denmark)

    Horn, T; Henriksen, Jens Henrik Sahl; Christoffersen, P

    1986-01-01

    The scanning electron microscopic was used to study the fenestrations of human liver sinusoids. Thirteen biopsies, where light microscopy and transmission electron microscopy revealed normal sinusoidal architecture, were investigated. The number of fenestrae was calculated in acinar zone 3...

  1. The Design and Construction of a Simple Transmission Electron Microscope for Educational Purposes.

    Science.gov (United States)

    Hearsey, Paul K.

    This document presents a model for a simple transmission electron microscope for educational purposes. This microscope could demonstrate thermonic emission, particle acceleration, electron deflection, and flourescence. It is designed to be used in high school science courses, particularly physics, taking into account the size, weight, complexity…

  2. Remote control scanning electron microscope with Web operation

    International Nuclear Information System (INIS)

    Yamada, A.; Hirahara, O.; Date, M.; Lozbin, V.; Tsuchida, T.; Sugano, N.

    2002-01-01

    Full text: Recently, SEM (Scanning Electron Microscope) and the other observation instruments are coming to use a LAN (Local Area Network) to save the image in the database. We developed a remote control system in which SEM image and Control interface is indicated on the WEB Browser. In this system, SEM can be controlled by an external (client) PC installed in a general WEB Browser (Internet Explorer). Accordingly, operation interface can be indicated on the WEB browser. A JSM-6700F is connected to a LAN, and so a client PC can control the microscope. The JSM-6700F has two lines to the LAN for image transfer and communication with the SEM control. In order to transfer the image, the image size squeezes from 1280 x 1024-pixels (SEM image size) to 640x480-pixels for quick transfer. The image signal (640 x 480-pixels) is connected to the video server only, and then the image transfers to the client PC via LAN. The SEM control communicates with client PC for external command. On the other hand, the SEM control interface and the image are indicated on WEB Browser (Internet explorer). The SEM control interface is composed of the SEM image area and the SEM control part. The SEM image indicates the 640x480-pixels live image. This live image is being used as a high resolution live image transfer in the image transfer technology which a network is used for at present. If it is LAN beyond 10 base, this indication of an image can be transferred fully. When it is connected in the small line of the capacity, the refresh speed of the image becomes slow because of image data doesn't finish transferring it. In such a case, image size can be changed smaller by the LAN conditions. When a high quality image is necessary, the image of 1280 x 1024-pixels is saved on a SEM (server) side by choosing the image save button. At the same time, the file kept in SEM (server) is transferred to the client PC automatically, so that we can display a high quality image on the client PC side. The

  3. Neural Network for Nanoscience Scanning Electron Microscope Image Recognition.

    Science.gov (United States)

    Modarres, Mohammad Hadi; Aversa, Rossella; Cozzini, Stefano; Ciancio, Regina; Leto, Angelo; Brandino, Giuseppe Piero

    2017-10-16

    In this paper we applied transfer learning techniques for image recognition, automatic categorization, and labeling of nanoscience images obtained by scanning electron microscope (SEM). Roughly 20,000 SEM images were manually classified into 10 categories to form a labeled training set, which can be used as a reference set for future applications of deep learning enhanced algorithms in the nanoscience domain. The categories chosen spanned the range of 0-Dimensional (0D) objects such as particles, 1D nanowires and fibres, 2D films and coated surfaces, and 3D patterned surfaces such as pillars. The training set was used to retrain on the SEM dataset and to compare many convolutional neural network models (Inception-v3, Inception-v4, ResNet). We obtained compatible results by performing a feature extraction of the different models on the same dataset. We performed additional analysis of the classifier on a second test set to further investigate the results both on particular cases and from a statistical point of view. Our algorithm was able to successfully classify around 90% of a test dataset consisting of SEM images, while reduced accuracy was found in the case of images at the boundary between two categories or containing elements of multiple categories. In these cases, the image classification did not identify a predominant category with a high score. We used the statistical outcomes from testing to deploy a semi-automatic workflow able to classify and label images generated by the SEM. Finally, a separate training was performed to determine the volume fraction of coherently aligned nanowires in SEM images. The results were compared with what was obtained using the Local Gradient Orientation method. This example demonstrates the versatility and the potential of transfer learning to address specific tasks of interest in nanoscience applications.

  4. Electron microscopic study on radiosensitivity of uterine cervical cancer

    Energy Technology Data Exchange (ETDEWEB)

    Iwai, S; Shiozawa, K; Tsukamoto, T; Noguchi, H; Tsukahara, Y [Shinshu Univ., Matsumoto, Nagano (Japan). Faculty of Medicine

    1974-11-01

    The effects of 1000 R of tele-cobalt upon the changes in the primary lesions of uterine cervical cancer with time were studied with an electron microscope. In addition, twenty cases which were proven to have cancer tissues (10 cases of IInd stage of cancer, 8 cases of IIIrd stage of cancer and 2 cases of IVth stage of cancer) were studied. Four cases were favourably sensitive, 7 cases moderately sensitive and 9 cases unfavourably sensitive to radiation. In favourably radio-sensitive cases, the changes in the cancer cells first appeared in the nucleus. There were other changes such as local clumping of chromatin and, specifically, vacuolization of the nucleus. The changes in the endoplasmic reticulum appeared somewhat late. In addition, the disturbance of mitochondria and the decrease or disappearance of ribosomes were specifically due to radiation injury. From the point of view of changes with time, Golgi's apparatus was enlarged and the membrane of the endoplasmic reticulum was degenerated at the 1st day. At the 3rd day, vacuolization of the nucleus appeared, the nuclear corpuscles were increased, the nucleoplasm became thin, and mitochondria was enlarged and degenerated. At the 5th day, the nuclear membrane disappeared, the nucleus was destroyed, large vacuolization of the endoplasmic reticulum was seen, free ribosomes were decreased, and changes around the endoplasmic reticulum were observed. At the 7th day, collagen around the endoplasmic reticulum appeared. In favourably radiosensitive cases, individual tumor cells showed the same degeneration, which fairly corresponded to that evaluated by the histological observation. The disturbance of the cells was caused by radiation, so-called ''burning'' of the cells. Radiation protection of the cells against burning was considered in terms of their radiosensitivity.

  5. Digital acquisition and processing of electron micrographs using a scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Engel, A.; Christen, F.; Michel, B.

    1981-01-01

    A digital acquisition system that collects multichannel information from a scanning transmission electron microscope (STEM) and its application are described. The hardware comprises (i) single electron counting detectors, (ii) a digital scan generator, (iii) a digital multi-channel on-line processor, (iv) an interface to a minicomputer, and (v) a display system. Experimental results characterizing these components are presented, and their performance is discussed. The software includes assembler coded programs for dynamic file maintenance and fast acquisition of image data, a display driver, and FORTRAN coded application programs. The usefulness of digitized STEM is illustrated by a variety of biological applications. (orig.)

  6. Effects of strain on the electronic structure, superconductivity, and nematicity in FeSe studied by angle-resolved photoemission spectroscopy

    Science.gov (United States)

    Phan, G. N.; Nakayama, K.; Sugawara, K.; Sato, T.; Urata, T.; Tanabe, Y.; Tanigaki, K.; Nabeshima, F.; Imai, Y.; Maeda, A.; Takahashi, T.

    2017-06-01

    One of central issues in iron-based superconductors is the role of structural change to the superconducting transition temperature (Tc). It was found in FeSe that the lattice strain leads to a drastic increase in Tc, accompanied by suppression of nematic order. By angle-resolved photoemission spectroscopy on tensile- or compressive-strained and strain-free FeSe, we experimentally show that the in-plane strain causes a marked change in the energy overlap (Δ Eh -e ) between the hole and electron pockets in the normal state. The change in Δ Eh -e modifies the Fermi-surface volume, leading to a change in Tc. Furthermore, the strength of nematicity is also found to be characterized by Δ Eh -e . These results suggest that the key to understanding the phase diagram is the fermiology and interactions linked to the semimetallic band overlap.

  7. Recent progress in energy-filtered high energy X-ray photoemission electron microscopy using a Wien filter type energy analyzer

    International Nuclear Information System (INIS)

    Niimi, H.; Tsutsumi, T.; Matsudaira, H.; Kawasaki, T.; Suzuki, S.; Chun, W.-J.; Kato, M.; Kitajima, Y.; Iwasawa, Y.; Asakura, K.

    2004-01-01

    Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a microscopy technique which has the potential to provide surface chemical mapping during surface chemical processes on the nanometer scale. We studied the possibilities of EXPEEM using a Wien filter type energy analyzer in the high energy X-ray region above 1000 eV. We have successfully observed the EXPEEM images of Au islands on a Ta sheet using Au 3d 5/2 and Ta 3d 5/2 photoelectron peaks which were excited by 2380 eV X-rays emitted from an undulator (BL2A) at Photon Factory. Our recent efforts to improve the sensitivity of the Wien filter energy analyzer will also be discussed

  8. Valence band electronic structure of Ho-doped La0.67Ca0.33MnO3 using ultra-violet photoemission spectroscopy

    Science.gov (United States)

    Rout, S. K.; Mukharjee, R. N.; Mishra, D. K.; Roul, B. K.; Sekhar, B. R.; Dalai, M. K.

    2017-05-01

    In this manuscript we report the valence band electronic structure of Ho doped La0.67Ca0.33MnO3 using ultraviolet photoemission spectroscopy. We compared the density of states of La0.67Ca0.33MnO3, La0.67Ca0.3Ho0.03MnO3 and La0.64Ho0.03Ca0.33MnO3 near the Fermi level at various temperatures. Significant amount of changes have been observed at higher temperatures (220 K and 300 K) where the near Fermi level density of states increases with Ho doping into La0.67Ca0.33MnO3 indicating the enhancement of magnitude of change in metallicity (conductivity).

  9. Electronic structure of the iron-based superconductor (La,Eu)FeAsO1-xFx investigated by laser photoemission spectroscopy

    Science.gov (United States)

    Malaeb, Walid; Awad, Ramadan; Hibino, Taku; Kamihara, Yoichi; Kondo, Takeshi; Shin, Shik

    2018-05-01

    We have implemented laser photoemission spectroscopy (PES) to investigate the electronic structure of the iron-based superconductor (La,Eu)FeAsO1-xFx (LaEu1111) which is an interesting compound in the "1111" family showing a high value of the superconducting (SC) transition temperature (Tc) due to Eu doping. At least two energy scales were observed from the PES data in the SC compound: One at ∼14 meV closing around Tc and thus corresponding to the SC gap. Another energy scale appears at ∼35 meV and survives at temperatures above Tc which represents the pseudogap (PG). The non-SC sample (La,Eu)FeAsO shows a PG at ∼ 41 meV. These observations in this new superconductor are consistent with the general trend followed by other compounds in the "1111" family.

  10. Electron beam dynamics in an ultrafast transmission electron microscope with Wehnelt electrode

    Energy Technology Data Exchange (ETDEWEB)

    Bücker, K.; Picher, M.; Crégut, O. [Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg (France); LaGrange, T. [Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne, 1015 Lausanne (Switzerland); Reed, B.W.; Park, S.T.; Masiel, D.J. [Integrated Dynamic Electron Solutions, Inc., 5653 Stoneridge Drive 117, Pleasanton, CA 94588 (United States); Banhart, F., E-mail: florian.banhart@ipcms.unistra.fr [Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504 CNRS, Université de Strasbourg, 23 rue du Loess, 67034 Strasbourg (France)

    2016-12-15

    High temporal resolution transmission electron microscopy techniques have shown significant progress in recent years. Using photoelectron pulses induced by ultrashort laser pulses on the cathode, these methods can probe ultrafast materials processes and have revealed numerous dynamic phenomena at the nanoscale. Most recently, the technique has been implemented in standard thermionic electron microscopes that provide a flexible platform for studying material's dynamics over a wide range of spatial and temporal scales. In this study, the electron pulses in such an ultrafast transmission electron microscope are characterized in detail. The microscope is based on a thermionic gun with a Wehnelt electrode and is operated in a stroboscopic photoelectron mode. It is shown that the Wehnelt bias has a decisive influence on the temporal and energy spread of the picosecond electron pulses. Depending on the shape of the cathode and the cathode-Wehnelt distance, different emission patterns with different pulse parameters are obtained. The energy spread of the pulses is determined by space charge and Boersch effects, given by the number of electrons in a pulse. However, filtering effects due to the chromatic aberrations of the Wehnelt electrode allow the extraction of pulses with narrow energy spreads. The temporal spread is governed by electron trajectories of different length and in different electrostatic potentials. High temporal resolution is obtained by excluding shank emission from the cathode and aberration-induced halos in the emission pattern. By varying the cathode-Wehnelt gap, the Wehnelt bias, and the number of photoelectrons in a pulse, tradeoffs between energy and temporal resolution as well as beam intensity can be made as needed for experiments. Based on the characterization of the electron pulses, the optimal conditions for the operation of ultrafast TEMs with thermionic gun assembly are elaborated. - Highlights: • A detailed characterization of electron

  11. Plasmon Enhanced Photoemission

    Energy Technology Data Exchange (ETDEWEB)

    Polyakov, Aleksandr [Univ. of California, Berkeley, CA (United States)

    2012-05-08

    Next generation ultrabright light sources will operate at megahertz repetition rates with temporal resolution in the attosecond regime. For an X-Ray Free Electron Laser (FEL) to operate at such repetition rate requires a high quantum efficiency (QE) cathode to produce electron bunches of 300 pC per 1.5 μJ incident laser pulse. Semiconductor photocathodes have sufficient QE in the ultraviolet (UV) and the visible spectrum, however, they produce picosecond electron pulses due to the electron-phonon scattering. On the other hand, metals have two orders of magnitude less QE, but can produce femtosecond pulses, that are required to form the optimum electron distribution for high efficiency FEL operation. In this work, a novel metallic photocathode design is presented, where a set of nano-cavities is introduced on the metal surface to increase its QE to meet the FEL requirements, while maintaining the fast time response. Photoemission can be broken up into three steps: (1) photon absorption, (2) electron transport to the surface, and (3) crossing the metal-vacuum barrier. The first two steps can be improved by making the metal completely absorbing and by localizing the fields closer to the metal surface, thereby reducing the electron travel distance. Both of these effects can be achieved by coupling the incident light to an electron density wave on the metal surface, represented by a quasi-particle, the Surface Plasmon Polariton (SPP). The photoemission then becomes a process where the photon energy is transferred to an SPP and then to an electron. The dispersion relation for the SPP defines the region of energies where such process can occur. For example, for gold, the maximum SPP energy is 2.4 eV, however, the work function is 5.6 eV, therefore, only a fourth order photoemission process is possible. In such process, four photons excite four plasmons that together excite only one electron. The yield of such non-linear process depends strongly on the light intensity. In

  12. Investigation of electronic states of infinite-layer SrFeO{sub 2} epitaxial thin films by X-ray photoemission and absorption spectroscopies

    Energy Technology Data Exchange (ETDEWEB)

    Chikamatsu, Akira, E-mail: chikamatsu@chem.s.u-tokyo.ac.jp [Department of Chemistry, University of Tokyo, Tokyo 113-0033 (Japan); Matsuyama, Toshiya [Department of Chemistry, University of Tokyo, Tokyo 113-0033 (Japan); Hirose, Yasushi [Department of Chemistry, The University of Tokyo, Tokyo 113-0033 (Japan); Kanagawa Academy of Science and Technology (KAST), Kawasaki 213-0012 (Japan); Kumigashira, Hiroshi; Oshima, Masaharu [Department of Applied Chemistry, University of Tokyo, Tokyo 113-8656 (Japan); Hasegawa, Tetsuya [Department of Chemistry, University of Tokyo, Tokyo 113-0033 (Japan); Kanagawa Academy of Science and Technology (KAST), Kawasaki 213-0012 (Japan)

    2012-01-15

    Highlights: Black-Right-Pointing-Pointer Electronic states of infinite-layer SrFeO{sub 2} films have been experimentally observed. Black-Right-Pointing-Pointer Fe 3d states have higher densities of states in the valence-band region. Black-Right-Pointing-Pointer Three peaks derived from Fe 3d states were observed in the conduction-band region. Black-Right-Pointing-Pointer Indirect bandgap value was determined to be 1.3 eV. - Abstract: We investigated the electronic states of a single-crystal SrFeO{sub 2} epitaxial thin film in the valence-band and conduction-band regions using synchrotron-radiation X-ray photoemission and absorption spectroscopies. Fe 2p-3d resonant photoemission measurements revealed that the Fe 3d states have higher densities of states at binding energies of 3-5 eV and 5-8.5 eV in the valence-band region. The O K-edge X-ray absorption spectrum exhibited three peaks in the Fe 3d-derived conduction band hybridized with O 2p states; these can be assigned to Fe 3d{sub xy}, 3d{sub xz} + 3d{sub yz}, and 3d{sub x}{sup 2}{sub -y}{sup 2}. In addition, the indirect bandgap value of the SrFeO{sub 2} film was determined to be 1.3 eV by transmission and absorption spectroscopies.

  13. Spin polarized electron source technology transferred from HE accelerators to electron microscopes

    International Nuclear Information System (INIS)

    Nakanishi, Tsutomu

    2009-01-01

    For many years, we have developed a technology of spin-polarized-electron-source (PES) for a future linear collider project (ILC). Various new techniques for achieving high polarization, high quantum efficiency, high current density, sub-nanosecond multi-bunch generation etc. were developed. Two fundamental technologies; reduction of dark current and preparation of extremely high vacuum environment to protect the Negative Electron Affinity (NEA) surface have been also developed. Using these PES technologies and a new transmission type photocathode, we recently succeeded in producing the high brightness and high polarization electron beam for the low energy electron microscope (LEEM). Our Spin-LEEM system enables the world-first dynamic observation of surface magnetic domain formed by evaporation on the metal substrate with ∼ 20 nm space resolutions. (author)

  14. Simulation of electron displacement damage in a high voltage electron microscope

    International Nuclear Information System (INIS)

    Ono, Susumu; Kanaya, Koichi

    1979-01-01

    By applying the fundamental theory of the neutron cooling to the conservation law of energy and momentum, the threshold energies of incident electrons for displacing atoms are calculated and illustrated periodically for the atomic number. And the observable damage due to the secondary action of displaced atoms in the practical use of a high voltage electron microscope is described for several materials and accelerating voltages. The trajectories of incident electrons and displaced atoms in several materials are simulated by a Monte-Carlo method, using rigorous formulas of electron scattering events, i.e. elastic and inelastic scattering cross-sections, ionization loss and plasmon excitation. The simulation results are substantially agreement with experiments. (author)

  15. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.

    Science.gov (United States)

    Sun, Cheng; Müller, Erich; Meffert, Matthias; Gerthsen, Dagmar

    2018-04-01

    Transmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

  16. Nonrelativistic quantum electrodynamic approach to photoemission theory

    International Nuclear Information System (INIS)

    Fujikawa, Takashi; Arai, Hiroko

    2005-01-01

    A new nonrelativistic many-body theory to analyze X-ray photoelectron spectroscopy (XPS) spectra has been developed on the basis of quantum electrodynamic (QED) Keldysh Green's function approach. To obtain XPS current density we calculate electron Green's function g which partly includes electron-photon interactions. We first separate longitudinal and transverse parts of these Green's functions in the Coulomb gauge. The transverse electron selfenergy describes the electron-photon interaction, whereas the longitudinal electron selfenergy describes the electron-electron interaction. We derive the QED Hedin's equation from which we obtain systematic skeleton expansion in the power series of the screened Coulomb interaction W and the photon Green's function D kl . We show the present theory provides a sound theoretical tool to study complicated many-body processes such as the electron propagation damping, intrinsic, extrinsic losses and their interference, and furthermore, resonant photoemission processes. We have also found the importance of the mixed photon Green's functions D 0k and D k0 which have been supposed to be unimportant for the XPS analyses. They, however, directly describe the radiation field screening. In this work, photon field screening effects are discussed in one-step theory, where the electron-photon interaction operator Δ is proved to be replaced by ε -1 Δ beyond linear approximation. Beyond free photon Green's function approximation, photon scatterings from the electron density are incorporated within the present QED theory. These photon field effects can directly describe the microscopic photon field spatial variation specific to near the surface region and nanoparticle systems

  17. Introductory photoemission theory

    International Nuclear Information System (INIS)

    Arai, Hiroko; Fujikawa, Takashi

    2010-01-01

    An introductory review is presented on the basis of many-body scattering theory. Some fundamental aspects of photoemission theory are discussed in detail. A few applications are also discussed; photoelectron diffraction, depth distribution function and multi-atom resonant photoemission are also discussed briefly. (author)

  18. Microscopic Superconductivity and Room Temperature Electronics of High-Tc Cuprates

    International Nuclear Information System (INIS)

    Liu Fusui; Chen Wanfang

    2008-01-01

    This paper points out that the Landau criterion for macroscopic superfluidity of He II is only a criterion for microscopic superfluidity of 4 He, extends the Landau criterion to microscopic superconductivity in fermions (electron and hole) system and system with Cooper pairs without long-range phase coherence. This paper gives another three non-superconductive systems that are of microscopic superconductivity. This paper demonstrates that one application of microscopic superconductivity is to establish room temperature electronics of the high-T c cuprates

  19. Transmission electron microscope studies of crystalline LiNbO3

    International Nuclear Information System (INIS)

    Pareja, R.; Gonzalez, R.; Chen, Y.

    1984-01-01

    Transmission electron microscope investigations in both as-grown and hydrogen-reduced LiNbO 3 reveal that niobium oxide precipitates can be produced by in situ irradiations in the electron microscope. The precipitation process is produced by a combined effect of ionizing electrons and the thermal heating of the specimens during irradiation. It is proposed that the composition of the precipitates is primarily Nb 2 O 5

  20. Apparatus and methods for controlling electron microscope stages

    Science.gov (United States)

    Duden, Thomas

    2015-08-11

    Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

  1. A simple way to obtain backscattered electron images in a scanning transmission electron microscope.

    Science.gov (United States)

    Tsuruta, Hiroki; Tanaka, Shigeyasu; Tanji, Takayoshi; Morita, Chiaki

    2014-08-01

    We have fabricated a simple detector for backscattered electrons (BSEs) and incorporated the detector into a scanning transmission electron microscope (STEM) sample holder. Our detector was made from a 4-mm(2) Si chip. The fabrication procedure was easy, and similar to a standard transmission electron microscopy (TEM) sample thinning process based on ion milling. A TEM grid containing particle objects was fixed to the detector with a silver paste. Observations were carried out using samples of Au and latex particles at 75 and 200 kV. Such a detector provides an easy way to obtain BSE images in an STEM. © The Author 2014. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  2. Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film.

    Science.gov (United States)

    Shiloh, Roy; Remez, Roei; Lu, Peng-Han; Jin, Lei; Lereah, Yossi; Tavabi, Amir H; Dunin-Borkowski, Rafal E; Arie, Ady

    2018-06-01

    Nearly eighty years ago, Scherzer showed that rotationally symmetric, charge-free, static electron lenses are limited by an unavoidable, positive spherical aberration. Following a long struggle, a major breakthrough in the spatial resolution of electron microscopes was reached two decades ago by abandoning the first of these conditions, with the successful development of multipole aberration correctors. Here, we use a refractive silicon nitride thin film to tackle the second of Scherzer's constraints and demonstrate an alternative method for correcting spherical aberration in a scanning transmission electron microscope. We reveal features in Si and Cu samples that cannot be resolved in an uncorrected microscope. Our thin film corrector can be implemented as an immediate low cost upgrade to existing electron microscopes without re-engineering of the electron column or complicated operation protocols and can be extended to the correction of additional aberrations. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

  3. Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements

    International Nuclear Information System (INIS)

    Koguchi, Masanari; Tsuneta, Ruriko; Anan, Yoshihiro; Nakamae, Koji

    2017-01-01

    An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle multi-capillary x-rays lens with a focal length of 5 mm, long-time data acquisition (e.g. longer than 26 h), and a drift-free system made it possible to visualize boron-dopant images in a Si substrate at a detection limit of 0.2 atomic percent. (paper)

  4. Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.

    Science.gov (United States)

    Zhu, Y; Inada, H; Nakamura, K; Wall, J

    2009-10-01

    Aberration correction has embarked on a new frontier in electron microscopy by overcoming the limitations of conventional round lenses, providing sub-angstrom-sized probes. However, improvement of spatial resolution using aberration correction so far has been limited to the use of transmitted electrons both in scanning and stationary mode, with an improvement of 20-40% (refs 3-8). In contrast, advances in the spatial resolution of scanning electron microscopes (SEMs), which are by far the most widely used instrument for surface imaging at the micrometre-nanometre scale, have been stagnant, despite several recent efforts. Here, we report a new SEM, with aberration correction, able to image single atoms by detecting electrons emerging from its surface as a result of interaction with the small probe. The spatial resolution achieved represents a fourfold improvement over the best-reported resolution in any SEM (refs 10-12). Furthermore, we can simultaneously probe the sample through its entire thickness with transmitted electrons. This ability is significant because it permits the selective visualization of bulk atoms and surface ones, beyond a traditional two-dimensional projection in transmission electron microscopy. It has the potential to revolutionize the field of microscopy and imaging, thereby opening the door to a wide range of applications, especially when combined with simultaneous nanoprobe spectroscopy.

  5. Electronic structure of transition metal dichalcogenides PdTe2 and Cu0.05PdTe2 superconductors obtained by angle-resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Liu Yan; Zhao Jian-Zhou; Yu Li; Hu Cheng; Liu De-Fa; Peng Ying-Ying; Xie Zhuo-Jin; He Jun-Feng; Chen Chao-Yu; Feng Ya; Yi He-Mian; Liu Xu; Zhao Lin; He Shao-Long; Liu Guo-Dong; Dong Xiao-Li; Zhang Jun; Lin Cheng-Tian; Chen Chuang-Tian; Xu Zu-Yan

    2015-01-01

    The layered transition metal chalcogenides have been a fertile land in solid state physics for many decades. Various MX 2 -type transition metal dichalcogenides, such as WTe 2 , IrTe 2 , and MoS 2 , have triggered great attention recently, either for the discovery of novel phenomena or some extreme or exotic physical properties, or for their potential applications. PdTe 2 is a superconductor in the class of transition metal dichalcogenides, and superconductivity is enhanced in its Cu-intercalated form, Cu 0.05 PdTe 2 . It is important to study the electronic structures of PdTe 2 and its intercalated form in order to explore for new phenomena and physical properties and understand the related superconductivity enhancement mechanism. Here we report systematic high resolution angle-resolved photoemission (ARPES) studies on PdTe 2 and Cu 0.05 PdTe 2 single crystals, combined with the band structure calculations. We present in detail for the first time the complex multi-band Fermi surface topology and densely-arranged band structure of these compounds. By carefully examining the electronic structures of the two systems, we find that Cu-intercalation in PdTe 2 results in electron-doping, which causes the band structure to shift downwards by nearly 16 meV in Cu 0.05 PdTe 2 . Our results lay a foundation for further exploration and investigation on PdTe 2 and related superconductors. (rapid communication)

  6. Electron microscopical studies of the common bile duct in reindeer

    Directory of Open Access Journals (Sweden)

    Timo Rahko

    1990-08-01

    Full Text Available In a previous publication the authors have described some ultrastructural characteristics of granulated cells in the common bile duct of the reindeer. On the basis of the same material, electron microscopic observations on other tissue elements of bile duct wall are now reported. The surface and glandular epithelium were composed of tall columnar epithelial cells with villous structures on the luminal surfaces. The parietal cytoplasmic membranes of epithelial cells were equipped with intercellular desmosomes while intraepithelial globule leucocytes did not form any junctional complex with other cells. Apical cytoplasmic areas of superficial epithelial cells showed electron-dense small bodies possibly consisting of mucinous substances. The goblet and deep glandular cells, on the other hand, contained numerous large mucin granules with less electron-dense matrices. It appears that their secretions are more abundant than those in superficial epithelial cells which obviously are absorptive as their main function. The nuclei and other cytoplasmic organelles showed profiles similar to those in epithelial cells generally. The lumen of the bile ducts was usually empty or contained fine-granular or amorphous material. An unusual feature was the presence of parts of globule leucocytes or even almost whole cells occurring freely in ductal secretions.Elektronimikroskooppinen tutkimus yhteisen sappikäytävän rakenteesta porolla.Abstract in Finnish / Yhteenveto: Aikaisemmassa julkaisussa tekijät kuvasivat poron yhteisen sappikäytävän (ductus hepaticus communis seinämän jyväsellisten solujen hienorakennetta. Tässä artikkelissa selostetaan saman aineiston perusteella (6 tervettä teurasporoa elektronimikroskooppisia havaintoja sappikäytäväseinämän muista kudosrakenteista. Sappikäytäväseinämän pinta- ja rauhasepiteeli koostuu korkeista epiteelisoluista. Pinnallisia epiteelisoluja kattavat säännölliset mikrovillukset, ja niillä on vain v

  7. Complex composition film condensation in the sluice device of an electron microscope

    International Nuclear Information System (INIS)

    Kukuev, V.I.; Lesovoj, M.V.; Vlasov, D.A.; Malygin, M.V.; Domashevskaya, Eh.P.; Tomashpol'skij, Yu.Ya.

    1994-01-01

    Based on the sluice device of an electron microscope a system is developed for material laser evaporation and vapor condensation on a substrate, situated in the microscope specimen holder. Substrate heating by laser radiation to 100 deg C is used. The system is applied for investigating growth of high-temperature superconductor films

  8. Oxidation mechanism of nickel particles studied in an environmental transmission electron microscope

    DEFF Research Database (Denmark)

    Jeangros, Q.; Hansen, Thomas Willum; Wagner, Jakob Birkedal

    2014-01-01

    The oxidation of nickel particles was studied in situ in an environmental transmission electron microscope in 3.2 mbar of O2 between ambient temperature and 600°C. Several different transmission electron microscopy imaging techniques, electron diffraction and electron energy-loss spectroscopy were...... diffusion of Ni2+ along NiO grain boundaries, self-diffusion of Ni2+ ions and vacancies, growth of NiO grains and nucleation of voids at Ni/NiO interfaces. We also observed the formation of transverse cracks in a growing NiO film in situ in the electron microscope....

  9. Differential ultrahigh-vacuum pump for electron microscope

    International Nuclear Information System (INIS)

    Kroshkov, A.A.; Aseev, A.L.; Baranova, E.A.; Latyshev, A.V.; Yakushenko, O.A.

    1985-01-01

    A differential cryogenic pump for the JEM-7A microscope is described. It reduces the vacuum pressure in the region of the specimen. The device allows tilting and movement of the specimen, direct electrical heating, measurement of specimen temperature, and deposition of films of various substances on the specimen surface. A diagram of the pump shows its placement in the objective chamber of the microscope. The fittings are equipped with bellows and provide for input and output of liquid nitrogen or liquid-helium vapor coolants. The enumerated results attest to a reduction of residual atmospheric pressure in the area of the specimen and the possibility of producing a pure silicon surface in the described device

  10. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

    Science.gov (United States)

    Wang, Peng; Behan, Gavin; Kirkland, Angus I; Nellist, Peter D; Cosgriff, Eireann C; D'Alfonso, Adrian J; Morgan, Andrew J; Allen, Leslie J; Hashimoto, Ayako; Takeguchi, Masaki; Mitsuishi, Kazutaka; Shimojo, Masayuki

    2011-06-01

    Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. Copyright © 2010 Elsevier B.V. All rights reserved.

  11. Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

    International Nuclear Information System (INIS)

    Oelsner, Andreas; Rohmer, Martin; Schneider, Christian; Bayer, Daniela; Schoenhense, Gerd; Aeschlimann, Martin

    2010-01-01

    The present work enlightens the developments in time- and energy resolved photoemission electron microscopy over the past few years. We describe basic principles of the technique and demonstrate different applications. An energy- and time-filtering photoemission electron microscopy (PEEM) for real-time spectroscopic imaging can be realized either by a retarding field or hemispherical energy analyzer or by using time-of-flight optics with a delay line detector. The latter method has the advantage of no data loss at all as all randomly incoming particles are measured not only by position but also by time. This is of particular interest for pump-probe experiments in the femtosecond and attosecond time scale where space charge processes drastically limit the maximum number of photoemitted electrons per laser pulse. This work focuses particularly on time-of-flight analysis using a novel delay line detector. Time and energy resolved PEEM instruments with delay line detectors enable 4D imaging (x, y, Δt, E Kin ) on a true counting basis. This allows a broad range of applications from real-time observation of dynamic phenomena at surfaces to fs time-of-flight spectro-microscopy and even aberration correction. By now, these time-of-flight analysis instruments achieve intrinsic time resolutions of 108 ps absolute and 13.5 ps relative. Very high permanent measurement speeds of more than 4 million events per second in random detection regimes have been realized using a standard USB2.0 interface. By means of this performance, the time-resolved PEEM technique enables to display evolutions of spatially resolved (<25 nm) and temporal sliced images life on any modern computer. The method allows dynamics investigations of variable electrical, magnetic, and optical near fields at surfaces and great prospects in dynamical adaptive photoelectron optics. For dynamical processes in the ps time scale such as magnetic domain wall movements, the time resolution of the delay line detectors

  12. Evolutionary developments in x ray and electron energy loss microanalysis instrumentation for the analytical electron microscope

    Science.gov (United States)

    Zaluzec, Nester J.

    Developments in instrumentation for both X ray Dispersive and Electron Energy Loss Spectroscopy (XEDS/EELS) over the last ten years have given the experimentalist a greatly enhanced set of analytical tools for characterization. Microanalysts have waited for nearly two decades now in the hope of getting a true analytical microscope and the development of 300 to 400 kV instruments should have allowed us to attain this goal. Unfortunately, this has not generally been the case. While there have been some major improvements in the techniques, there has also been some devolution in the modern AEM (Analytical Electron Microscope). In XEDS, the majority of today's instruments are still plagued by the hole count effect, which was first described in detail over fifteen years ago. The magnitude of this problem can still reach the 20 percent level for medium atomic number species in a conventional off-the-shelf intermediate voltage AEM. This is an absurd situation and the manufacturers should be severely criticized. Part of the blame, however, also rests on the AEM community for not having come up with a universally agreed upon standard test procedure. Fortunately, such a test procedure is in the early stages of refinement. The proposed test specimen consists of an evaporated Cr film approx. 500 to 1000A thick supported upon a 3mm diameter Molybdenum 200 micron aperture.

  13. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Peng; Behan, Gavin; Kirkland, Angus I. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Nellist, Peter D., E-mail: peter.nellist@materials.ox.ac.uk [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Cosgriff, Eireann C.; D' Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J. [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Hashimoto, Ayako [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Takeguchi, Masaki [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Mitsuishi, Kazutaka [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Quantum Dot Research Center, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Shimojo, Masayuki [High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

    2011-06-15

    Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. -- Research Highlights: {yields} The confocal probe image in a scanning confocal electron microscopy image reveals information about the thickness and height of the crystalline layer. {yields} The form of the contrast in a three-dimensional bright-field scanning confocal electron microscopy image can be explained in terms of the confocal probe image. {yields} Despite the complicated form of the contrast in bright-field scanning confocal electron microscopy, we see that depth information is transferred on a 10 nm scale.

  14. Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope.

    Science.gov (United States)

    Pascal, Elena; Singh, Saransh; Callahan, Patrick G; Hourahine, Ben; Trager-Cowan, Carol; Graef, Marc De

    2018-04-01

    Transmission Kikuchi diffraction (TKD) has been gaining momentum as a high resolution alternative to electron back-scattered diffraction (EBSD), adding to the existing electron diffraction modalities in the scanning electron microscope (SEM). The image simulation of any of these measurement techniques requires an energy dependent diffraction model for which, in turn, knowledge of electron energies and diffraction distances distributions is required. We identify the sample-detector geometry and the effect of inelastic events on the diffracting electron beam as the important factors to be considered when predicting these distributions. However, tractable models taking into account inelastic scattering explicitly are lacking. In this study, we expand the Monte Carlo (MC) energy-weighting dynamical simulations models used for EBSD [1] and ECP [2] to the TKD case. We show that the foil thickness in TKD can be used as a means of energy filtering and compare band sharpness in the different modalities. The current model is shown to correctly predict TKD patterns and, through the dictionary indexing approach, to produce higher quality indexed TKD maps than conventional Hough transform approach, especially close to grain boundaries. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

  15. Correlation between mechanical vibrations and resolving power of an electron microscope

    International Nuclear Information System (INIS)

    Lopez, J.J.

    1975-01-01

    The mechanical vibrations of the Grenoble 1MV electron microscope are analyzed. The solutions used to obtain a stability in the order of 3.10 -6 are exposed. A resolution of 1,8A should be achieved [fr

  16. Use of high voltage electron microscope to simulate radiation damage by neutrons

    International Nuclear Information System (INIS)

    Mayer, R.M.

    1976-01-01

    The use of the high voltage electron microscope to simulate radiation damage by neutrons is briefly reviewed. This information is important in explaining how alloying affects void formation during neutron irradiation

  17. Developments in inverse photoemission spectroscopy

    International Nuclear Information System (INIS)

    Sheils, W.; Leckey, R.C.G.; Riley, J.D.

    1996-01-01

    In the 1950's and 1960's, Photoemission Spectroscopy (PES) established itself as the major technique for the study of the occupied electronic energy levels of solids. During this period the field divided into two branches: X-ray Photoemission Spectroscopy (XPS) for photon energies greater than ∼l000eV, and Ultra-violet Photoemission Spectroscopy (UPS) for photon energies below ∼100eV. By the 1970's XPS and UPS had become mature techniques. Like XPS, BIS (at x-ray energies) does not have the momentum-resolving ability of UPS that has contributed much to the understanding of the occupied band structures of solids. BIS moved into a new energy regime in 1977 when Dose employed a Geiger-Mueller tube to obtain density of unoccupied states data from a tantalum sample at a photon energy of ∼9.7eV. At similar energies, the technique has since become known as Inverse Photoemission Spectroscopy (IPS), in acknowledgment of its complementary relationship to UPS and to distinguish it from the higher energy BIS. Drawing on decades of UPS expertise, IPS has quickly moved into areas of interest where UPS has been applied; metals, semiconductors, layer compounds, adsorbates, ferromagnets, and superconductors. At La Trobe University an IPS facility has been constructed. This presentation reports on developments in the experimental and analytical techniques of IPS that have been made there. The results of a study of the unoccupied bulk and surface bands of GaAs are presented

  18. Field emission from individual multiwalled carbon nanotubes prepared in an electron microscope

    NARCIS (Netherlands)

    de Jonge, N.; van Druten, N.J.

    2003-01-01

    Individual multiwalled carbon nanotube field emitters were prepared in a scanning electron microscope. The angular current density, energy spectra, and the emission stability of the field-emitted electrons were measured. An estimate of the electron source brightness was extracted from the

  19. Instrumentation at the National Center for Electron Microscopy: the Atomic Resolution Microscope

    International Nuclear Information System (INIS)

    Gronsky, R.; Thomas, G.

    1983-01-01

    The Atomic Resolution Microscope (ARM) is one of two unique high voltage electron microscopes at the Lawrence Berkeley Laboratory's National Center for Electron Microscopy (NCEM). The latest results from this new instrument which was manufactured by JEOL, Ltd. to the performance specifications of the NCEM, delivered in January of 1983, and soon to be open to access by the entire microscopy community are given. Details of its history and development are given and its performance specifications are reviewed

  20. Intrinsic spin polarized electronic structure of CrO2 epitaxial film revealed by bulk-sensitive spin-resolved photoemission spectroscopy

    International Nuclear Information System (INIS)

    Fujiwara, Hirokazu; Sunagawa, Masanori; Kittaka, Tomoko; Terashima, Kensei; Wakita, Takanori; Muraoka, Yuji; Yokoya, Takayoshi

    2015-01-01

    We have performed bulk-sensitive spin-resolved photoemission spectroscopy in order to clarify the intrinsic spin-resolved electronic states of half-metallic ferromagnet CrO 2 . We used CrO 2 epitaxial films on TiO 2 (100), which shows a peak at 1 eV with a clear Fermi edge, consistent with the bulk-sensitive PES spectrum for CrO 2 . In spin-resolved spectra at 40 K, while the Fermi edge was observed in the spin up (majority spin) state, no states at the Fermi level (E F ) with an energy gap of 0.5 eV below E F were observed in the spin down (minority spin) state. At 300 K, the gap in the spin down state closes. These results are consistent with resistivity measurements and magnetic hysteresis curves of the fabricated CrO 2 film, constituting spectroscopic evidence for the half-metallicity of CrO 2 at low temperature and reducing the spin polarization at room temperature. We also discuss the electron correlation effects of Cr 3d

  1. Multi-atom resonant photoemission and the development of next-generation software and high-speed detectors for electron spectroscopy

    International Nuclear Information System (INIS)

    Kay, Alexander William

    2000-01-01

    This dissertation has involved the exploration of a new effect in photoelectron emission, multi-atom resonant photoemission (MARPE), as well as the development of new software, data analysis techniques, and detectors of general use in such research. We present experimental and theoretical results related to MARPE, in which the photoelectron intensity from a core level on one atom is influenced by a core-level absorption resonance on another. We point out that some of our and others prior experimental data has been strongly influenced by detector non-linearity and that the effects seen in new corrected data are smaller and of different form. Corrected data for the MnO(001) system with resonance between the O 1s and Mn 2p energy levels are found to be well described by an extension of well-known intraatomic resonant photoemission theory to the interatomic case, provided that interactions beyond the usual second-order Kramers-Heisenberg treatment are included. This theory is also found to simplify under certain conditions so as to yield results equivalent to a classical x-ray optical approach, with the latter providing an accurate and alternative, although less detailed and general, physical picture of these effects. Possible future applications of MARPE as a new probe of near-neighbor identities and bonding and its relationship to other known effects are also discussed. We also consider in detail specially written data acquisition software that has been used for most of the measurements reported here. This software has been used with an existing experimental system to develop the method of detector characterization and then data correction required for the work described above. The development of a next generation one-dimensional, high-speed, electron detector is also discussed. Our goal has been to design, build and test a prototype high-performance, one-dimensional pulse-counting detector that represents a significant advancement in detector technology and is well

  2. Multi-atom resonant photoemission and the development of next-generation software and high-speed detectors for electron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Kay, Alexander William [Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

    2000-09-01

    This dissertation has involved the exploration of a new effect in photoelectron emission, multi-atom resonant photoemission (MARPE), as well as the development of new software, data analysis techniques, and detectors of general use in such research. We present experimental and theoretical results related to MARPE, in which the photoelectron intensity from a core level on one atom is influenced by a core-level absorption resonance on another. We point out that some of our and others prior experimental data has been strongly influenced by detector non-linearity and that the effects seen in new corrected data are smaller and of different form. Corrected data for the MnO(001) system with resonance between the O 1s and Mn 2p energy levels are found to be well described by an extension of well-known intraatomic resonant photoemission theory to the interatomic case, provided that interactions beyond the usual second-order Kramers-Heisenberg treatment are included. This theory is also found to simplify under certain conditions so as to yield results equivalent to a classical x-ray optical approach, with the latter providing an accurate and alternative, although less detailed and general, physical picture of these effects. Possible future applications of MARPE as a new probe of near-neighbor identities and bonding and its relationship to other known effects are also discussed. We also consider in detail specially written data acquisition software that has been used for most of the measurements reported here. This software has been used with an existing experimental system to develop the method of detector characterization and then data correction required for the work described above. The development of a next generation one-dimensional, high-speed, electron detector is also discussed. Our goal has been to design, build and test a prototype high-performance, one-dimensional pulse-counting detector that represents a significant advancement in detector technology and is well

  3. Performance of ultrahigh resolution electron microscope JEM-4000EX and some applications of high Tc superconductors

    International Nuclear Information System (INIS)

    Honda, T.; Ibe, K.; Ishida, Y.; Kersker, M.M.

    1989-01-01

    The high resolution electron microscope is powerful for modern materials science because of its direct observation capability for the atomic structure of materials. the JEM-4000EX, a 400 kV accelerating voltage electron microscope whose objective lens has a 1 mm spherical aberration coefficient, has a 0.168 nm theoretical resolving power. Using this microscope, atomic structure images of high Tc superconductor such as Y-Ba-Cu-O, Bi-Ca-Sr-Cu-O and Tl-Ca-Ba-Cu-O are reported

  4. Decontamination of digital image sensors and assessment of electron microscope performance in a BSL-3 containment

    Directory of Open Access Journals (Sweden)

    Michael B. Sherman

    2015-05-01

    Full Text Available A unique biological safety level (BSL-3 cryo-electron microscopy facility with a 200 keV high-end cryo-electron microscope has been commissioned at the University of Texas Medical Branch (UTMB to study the structure of viruses and bacteria classified as select agents. We developed a microscope decontamination protocol based on chlorine dioxide gas with a continuous flow system. In this paper we report on testing digital camera sensors (both CCD and CMOS direct detector in a BSL-3 environment, and microscope performance after chlorine dioxide (ClO2 decontamination cycles.

  5. Scanning electron microscope - some aspects of the instrument and its applications

    International Nuclear Information System (INIS)

    Thatte, M.R.

    1976-01-01

    Development of the science of microscopy leading to three different types of microscopes - the optical, the conventional transmission electron microscope (CTEM) and the scanning electron microscope(SEM) has been discussed. Special advantages of the SEM in the solution of problems in industrial laboratories are mentioned. A brief reference to the latest instruments announced by Siemens AG shows the modern trends in the technique. A close similarity in image building between SEM and television is indicated. Operational anatomy of the SEM is reviewed. (author)

  6. Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film.

    Science.gov (United States)

    Nishiyama, Hidetoshi; Suga, Mitsuo; Ogura, Toshihiko; Maruyama, Yuusuke; Koizumi, Mitsuru; Mio, Kazuhiro; Kitamura, Shinichi; Sato, Chikara

    2010-03-01

    Direct observation of subcellular structures and their characterization is essential for understanding their physiological functions. To observe them in open environment, we have developed an inverted scanning electron microscope with a detachable, open-culture dish, capable of 8 nm resolution, and combined with a fluorescence microscope quasi-simultaneously observing the same area from the top. For scanning electron microscopy from the bottom, a silicon nitride film window in the base of the dish maintains a vacuum between electron gun and open sample dish while allowing electrons to pass through. Electrons are backscattered from the sample and captured by a detector under the dish. Cells cultured on the open dish can be externally manipulated under optical microscopy, fixed, and observed using scanning electron microscopy. Once fine structures have been revealed by scanning electron microscopy, their component proteins may be identified by comparison with separately prepared fluorescence-labeled optical microscopic images of the candidate proteins, with their heavy-metal-labeled or stained ASEM images. Furthermore, cell nuclei in a tissue block stained with platinum-blue were successfully observed without thin-sectioning, which suggests the applicability of this inverted scanning electron microscope to cancer diagnosis. This microscope visualizes mesoscopic-scale structures, and is also applicable to non-bioscience fields including polymer chemistry. (c) 2010 Elsevier Inc. All rights reserved.

  7. Construction of a four tip scanning tunneling microscope/scanning electron microscope combination and conductivity measurements of silicide nanowires

    International Nuclear Information System (INIS)

    Zubkov, Evgeniy

    2013-01-01

    In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7 x 7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement

  8. Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.

    Science.gov (United States)

    Postek, Michael T; Vladár, András E; Villarrubia, John S; Muto, Atsushi

    2016-08-01

    Dimensional measurements from secondary electron (SE) images were compared with those from backscattered electron (BSE) and low-loss electron (LLE) images. With the commonly used 50% threshold criterion, the lines consistently appeared larger in the SE images. As the images were acquired simultaneously by an instrument with the capability to operate detectors for both signals at the same time, the differences cannot be explained by the assumption that contamination or drift between images affected the SE, BSE, or LLE images differently. Simulations with JMONSEL, an electron microscope simulator, indicate that the nanometer-scale differences observed on this sample can be explained by the different convolution effects of a beam with finite size on signals with different symmetry (the SE signal's characteristic peak versus the BSE or LLE signal's characteristic step). This effect is too small to explain the >100 nm discrepancies that were observed in earlier work on different samples. Additional modeling indicates that those discrepancies can be explained by the much larger sidewall angles of the earlier samples, coupled with the different response of SE versus BSE/LLE profiles to such wall angles.

  9. Path-separated electron interferometry in a scanning transmission electron microscope

    Science.gov (United States)

    Yasin, Fehmi S.; Harvey, Tyler R.; Chess, Jordan J.; Pierce, Jordan S.; McMorran, Benjamin J.

    2018-05-01

    We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the  +1 diffraction order probe through amorphous carbon while passing the 0th and  ‑1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.

  10. A Dust Grain Photoemission Experiment

    Science.gov (United States)

    Venturini, C. C.; Spann, J. F., Jr.; Abbas, M. M.; Comfort, R. H.

    2000-01-01

    A laboratory experiment has been developed at Marshall Space Flight Center to study the interaction of micron-sized particles with plasmas and FUV radiation. The intent is to investigate the conditions under which particles of various compositions and sizes become charged, or discharged, while exposed to an electron beam and/or UV radiation. This experiment uses a unique laboratory where a single charged micron size particle is suspended in a quadrupole trap and then subjected to a controlled environment. Tests are performed using different materials and sizes, ranging from 10 microns to 1 micron, to determine the particle's charge while being subjected to an electron beam and /or UV radiation. The focus of this presentation will be on preliminary results from UV photoemission tests, but past results from electron beam, secondary electron emission tests will also be highlighted. A monochromator is used to spectrally resolve UV in the 120 nm to 300 nm range. This enables photoemission measurements as a function of wavelength. Electron beam tests are conducted using I to 3 micron sized aluminum oxide particles subjected to energies between 100 eV to 3 KeV. It was found that for both positive and negative particles the potential tended toward neutrality over time with possible equilibrium potentials between -0.8 Volts and 0.8 Volts.

  11. Instrument developments for inverse photoemission

    International Nuclear Information System (INIS)

    Brenac, A.

    1987-02-01

    Experimental developments principally concerning electron sources for inverse photoemission are presented. The specifications of the electron beam are derived from experiment requirements, taking into account the limitations encountered (space charge divergence). For a wave vector resolution of 0.2 A -1 , the maximum current is 25 microA at 20 eV. The design of a gun providing such a beam in the range 5 to 50 eV is presented. Angle-resolved inverse photoemission experiments show angular effects at 30 eV. For an energy of 10 eV, angular effects should be stronger, but the low efficiency of the spectrometer in this range makes the experiments difficult. The total energy resolution of 0.3 eV is the result mainly of electron energy spread, as expected. The electron sources are based on field effect electron emission from a cathode consisting of a large number of microtips. The emission arises from a few atomic cells for each tip. The ultimate theoretical energy spread is 0.1 eV. This value is not attained because of an interface resistance problem. A partial solution of this problem allows measurement of an energy spread of 0.9 eV for a current of 100 microA emitted at 60 eV. These cathodes have a further advantage in that emission can occur at a low temperature [fr

  12. Spin-polarized photoemission

    International Nuclear Information System (INIS)

    Johnson, Peter D.

    1997-01-01

    Spin-polarized photoemission has developed into a versatile tool for the study of surface and thin film magnetism. In this review, we examine the methodology of the technique and its application to a number of different problems, including both valence band and core level studies. After a detailed review of spin-polarization measurement techniques and the related experimental requirements we consider in detail studies of the bulk properties both above and below the Curie temperature. This section also includes a discussion of observations relating to unique metastable phases obtained via epitaxial growth. The application of the technique to the study of surfaces, both clean and adsorbate covered, is reviewed. The report then examines, in detail, studies of the spin-polarized electronic structure of thin films and the related interfacial magnetism. Finally, observations of spin-polarized quantum well states in non-magnetic thin films are discussed with particular reference to their mediation of the oscillatory exchange coupling in related magnetic multilayers. (author)

  13. Light and electron microscope assessment of the lytic activity of ...

    African Journals Online (AJOL)

    The Microcystis cells were exposed to copper, B. mycoides B16 and Triton X-100, in order to ascertain the level of cell membrane damage. The membrane cell damage ... The electron microscopy observations appeared to reveal at least two mechanisms of Microcystis lysis (contact and parasitism). The light and electron ...

  14. A new program for the design of electron microscopes

    Czech Academy of Sciences Publication Activity Database

    Lencová, Bohumila; Zlámal, J.

    2008-01-01

    Roč. 1, č. 1 (2008), s. 315-324 ISSN 1875-3892. [International Conference on Charged Particle Optics /7./ CPO-7. Cambridge, 24.07.2006-28.07.2006] Institutional research plan: CEZ:AV0Z20650511 Keywords : finite element method * electron lenses and deflectors * computer-aided design * user interface Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

  15. An Electron Microscope Study of the Yeast Pityrosporum ovale

    NARCIS (Netherlands)

    Kreger-van Rij, N.J.W.; Veenhuis, M.

    1970-01-01

    Cells of Pityrosporum ovale were prepared for electron microscopy by different methods of fixation and embedding, all of them causing some degree of damage to the cells. Apart from the usual organelles seen in other yeast cells, a body was found which showed an electron-dense outer layer and an

  16. Note: A scanning electron microscope sample holder for bidirectional characterization of atomic force microscope probe tips

    Energy Technology Data Exchange (ETDEWEB)

    Eisenstein, Alon; Goh, M. Cynthia [Department of Chemistry and Institute for Optical Sciences, University of Toronto, 80 St. George Street, Toronto M5S 3H6 (Canada)

    2012-03-15

    A novel sample holder that enables atomic force microscopy (AFM) tips to be mounted inside a scanning electron microscopy (SEM) for the purpose of characterizing the AFM tips is described. The holder provides quick and easy handling of tips by using a spring clip to hold them in place. The holder can accommodate two tips simultaneously in two perpendicular orientations, allowing both top and side view imaging of the tips by the SEM.

  17. A New Spin on Photoemission Spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Jozwiak, Chris [Univ. of California, Berkeley, CA (United States)

    2008-12-01

    The electronic spin degree of freedom is of general fundamental importance to all matter. Understanding its complex roles and behavior in the solid state, particularly in highly correlated and magnetic materials, has grown increasingly desirable as technology demands advanced devices and materials based on ever stricter comprehension and control of the electron spin. However, direct and efficient spin dependent probes of electronic structure are currently lacking. Angle Resolved Photoemission Spectroscopy (ARPES) has become one of the most successful experimental tools for elucidating solid state electronic structures, bolstered by-continual breakthroughs in efficient instrumentation. In contrast, spin-resolved photoemission spectroscopy has lagged behind due to a lack of similar instrumental advances. The power of photoemission spectroscopy and the pertinence of electronic spin in the current research climate combine to make breakthroughs in Spin and Angle Resolved Photoemission Spectroscopy (SARPES) a high priority . This thesis details the development of a unique instrument for efficient SARPES and represents a radical departure from conventional methods. A custom designed spin polarimeter based on low energy exchange scattering is developed, with projected efficiency gains of two orders of magnitude over current state-of-the-art polarimeters. For energy analysis, the popular hemispherical analyzer is eschewed for a custom Time-of-Flight (TOF) analyzer offering an additional order of magnitude gain in efficiency. The combined instrument signifies the breakthrough needed to perform the high resolution SARPES experiments necessary for untangling the complex spin-dependent electronic structures central to today's condensed matter physics.

  18. Automated grain mapping using wide angle convergent beam electron diffraction in transmission electron microscope for nanomaterials.

    Science.gov (United States)

    Kumar, Vineet

    2011-12-01

    The grain size statistics, commonly derived from the grain map of a material sample, are important microstructure characteristics that greatly influence its properties. The grain map for nanomaterials is usually obtained manually by visual inspection of the transmission electron microscope (TEM) micrographs because automated methods do not perform satisfactorily. While the visual inspection method provides reliable results, it is a labor intensive process and is often prone to human errors. In this article, an automated grain mapping method is developed using TEM diffraction patterns. The presented method uses wide angle convergent beam diffraction in the TEM. The automated technique was applied on a platinum thin film sample to obtain the grain map and subsequently derive grain size statistics from it. The grain size statistics obtained with the automated method were found in good agreement with the visual inspection method.

  19. Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

    Science.gov (United States)

    Inada, H; Su, D; Egerton, R F; Konno, M; Wu, L; Ciston, J; Wall, J; Zhu, Y

    2011-06-01

    We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. Copyright © 2010 Elsevier B.V. All rights reserved.

  20. Accurate virus quantitation using a Scanning Transmission Electron Microscopy (STEM) detector in a scanning electron microscope.

    Science.gov (United States)

    Blancett, Candace D; Fetterer, David P; Koistinen, Keith A; Morazzani, Elaine M; Monninger, Mitchell K; Piper, Ashley E; Kuehl, Kathleen A; Kearney, Brian J; Norris, Sarah L; Rossi, Cynthia A; Glass, Pamela J; Sun, Mei G

    2017-10-01

    A method for accurate quantitation of virus particles has long been sought, but a perfect method still eludes the scientific community. Electron Microscopy (EM) quantitation is a valuable technique because it provides direct morphology information and counts of all viral particles, whether or not they are infectious. In the past, EM negative stain quantitation methods have been cited as inaccurate, non-reproducible, and with detection limits that were too high to be useful. To improve accuracy and reproducibility, we have developed a method termed Scanning Transmission Electron Microscopy - Virus Quantitation (STEM-VQ), which simplifies sample preparation and uses a high throughput STEM detector in a Scanning Electron Microscope (SEM) coupled with commercially available software. In this paper, we demonstrate STEM-VQ with an alphavirus stock preparation to present the method's accuracy and reproducibility, including a comparison of STEM-VQ to viral plaque assay and the ViroCyt Virus Counter. Copyright © 2017 The Authors. Published by Elsevier B.V. All rights reserved.

  1. ZnO nanocrystals on SiO2/Si surfaces thermally cleaned in ultrahigh vacuum and characterized using spectroscopic photoemission and low energy electron microscopy

    International Nuclear Information System (INIS)

    Ericsson, Leif K. E.; Magnusson, Kjell O.; Zakharov, Alexei A.

    2010-01-01

    Thermal cleaning in ultrahigh vacuum of ZnO nanocrystals distributed on SiO 2 /Si surfaces has been studied using spectroscopic photoemission and low energy electron microscopy (SPELEEM). This study thus concern weakly bound ZnO nanocrystals covering only 5%-10% of the substrate. Chemical properties, crystallinity, and distribution of nanocrystals are used to correlate images acquired with the different techniques showing excellent correspondence. The nanocrystals are shown to be clean enough after thermal cleaning at 650 deg. C to be imaged by LEEM and x-ray PEEM as well as chemically analyzed by site selective x-ray photoelectron spectroscopy (μ-XPS). μ-XPS shows a sharp Zn 3d peak and resolve differences in O 1s states in oxides. The strong LEEM reflections together with the obtained chemical information indicates that the ZnO nanocrystals were thermally cleaned, but do not indicate any decomposition of the nanocrystals. μ-XPS was also used to determine the thickness of SiO 2 on Si. This article is the first to our knowledge where the versatile technique SPELEEM has been used to characterize ZnO nanocrystals.

  2. Electronic structure, photoemission spectra, and vacuum-ultraviolet optical spectra of CsPbCl3 and CsPbBr3

    Science.gov (United States)

    Heidrich, K.; Schäfer, W.; Schreiber, M.; Söchtig, J.; Trendel, G.; Treusch, J.; Grandke, T.; Stolz, H. J.

    1981-11-01

    Optical spectra of CsPbCl3 and CsPbBr3 have been measured in the range from 2 to 10 eV and have been combined with ultraviolet-photoemission-spectroscopy (UPS)-measurements at 21.1 and 40.8 eV. A quantitative band calculation is presented, which takes into account anion-anion interaction as well as electronic states of the Cs+ ion. The prominent features of earlier band models and measurements are reestablished through our measurements and calculations, namely that the valence band consists of anionic p functions and Pb 6s functions, the lowest conduction band being Pb 6p type, and the lowest gap occuring at the R point of the Brillouin zone. Inclusion of a further (Cs 6s-type) conduction band, however, is necessary to bring the calculated joint density of states into agreement with vacuum-ultraviolet optical spectra. The calculated densities of states of the valence bands are in quantitative agreement with those deduced from our UPS measurements.

  3. Local texture measurements with the scanning electron microscope

    International Nuclear Information System (INIS)

    Gottstein, G.; Engler, O.

    1993-01-01

    Techniques for convenient measurement of the crystallographic orientation of small volumes in bulk samples by electron diffraction in the SEM are discussed. They make use of Selected Area Electron Channelling Patterns (SAECP) and Electron Back Scattering Patterns (EBSP). The principle of pattern formation as well as measuring and evaluation procedure are introduced. The methods offer a viable procedure for obtaining information on the spatial arrangement of orientations, i.e. on orientation topography. Thus, they provide a new level of information on crystallographic texture. An application of the techniques for local texture measurements is demonstrated by an example, namely for investigation of considering the recrystallization behaviour of binary Al-1.3% Mn with large precipitates. Finally, further developments of the EBSP technique are addressed. (orig.)

  4. Angularly-selective transmission imaging in a scanning electron microscope.

    Science.gov (United States)

    Holm, Jason; Keller, Robert R

    2016-08-01

    This work presents recent advances in transmission scanning electron microscopy (t-SEM) imaging control capabilities. A modular aperture system and a cantilever-style sample holder that enable comprehensive angular selectivity of forward-scattered electrons are described. When combined with a commercially available solid-state transmission detector having only basic bright-field and dark-field imaging capabilities, the advances described here enable numerous transmission imaging modes. Several examples are provided that demonstrate how contrast arising from diffraction to mass-thickness can be obtained. Unanticipated image contrast at some imaging conditions is also observed and addressed. Published by Elsevier B.V.

  5. Catalysts under Controlled Atmospheres in the Transmission Electron Microscope

    DEFF Research Database (Denmark)

    Hansen, Thomas Willum; Wagner, Jakob Birkedal

    2014-01-01

    of resolution. Using suitably clean gases, modified pumping schemes, and short pathways through dense gas regions, these issues are now circumvented. Here we provide an account of best practice using environmental transmission electron microscopy on catalytic systems illustrated using select examples from......Over time, there has been an increasing interest in observing catalysts in their operating environment at high spatial resolution and ultimately to determine the structure of a catalytically active surface. One tool with the potential to do exactly this in direct space is the transmission electron...

  6. Secondary mineralization in carious lesions of human dentin. Electron-probe, electron microscope, and electron diffraction studies

    Energy Technology Data Exchange (ETDEWEB)

    Ogiwara, H [Tokyo Dental Coll. (Japan)

    1975-02-01

    Dentinal carious lesions having a remineralized surface layer were studied by means electron-probe microanalysis, electron microscopy, electron diffraction. As the results of electron-probe study, F, Mg, and Na were found to be distributed mainly in the remineralized surface layer and S in the decalcified region where decreases in Ca, P, and Mg concentration were usually observed. The decrease in Mg concentration always started earlier than that of Ca and P concentration. Electron microscope and electron diffraction studies revealed that apatic crystals in the remineralized surface layer were much larger than those in the intact dentin. Although they were less conspicuous, crystals in the decalcified region also were larger than those in the intact region. Dentinal tubules, occluded by many crystals, were frequently seen during the observations. Crystals in the tubules varied in morphology, showing granular, needle, rhomboid, and tabular shapes. By means of electron diffraction, the granular- or needle-shaped crystals were identified as apatite and the rhomboid-shaped crystals as whitlockite. Some of the tabular-shaped crystals appeared to be cotacalcium phosphate.

  7. Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope

    Czech Academy of Sciences Publication Activity Database

    Radlička, Tomáš

    2015-01-01

    Roč. 21, S4 (2015), s. 212-217 ISSN 1431-9276 R&D Projects: GA MŠk(CZ) LO1212 Institutional support: RVO:68081731 Keywords : scanning electron microscope * optical calculation Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.730, year: 2015

  8. Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope

    International Nuclear Information System (INIS)

    Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

    1981-01-01

    The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected

  9. [Scanning electron microscope study of chemically disinfected endodontic files].

    Science.gov (United States)

    Navarro, G; Mateos, M; Navarro, J L; Canalda, C

    1991-01-01

    Forty stainless steel endodontic files were observed at scanning electron microscopy after being subjected to ten disinfection cycles of 10 minutes each one, immersed in different chemical disinfectants. Corrosion was not observed on the surface of the files in circumstances that this study was made.

  10. Removal of Vesicle Structures from Transmission Electron Microscope Images

    DEFF Research Database (Denmark)

    Jensen, Katrine Hommelhoff; Sigworth, Fred; Brandt, Sami Sebastian

    2015-01-01

    In this paper, we address the problem of imaging membrane proteins for single-particle cryo-electron microscopy reconstruction of the isolated protein structure. More precisely, we propose a method for learning and removing the interfering vesicle signals from the micrograph, prior to reconstruct...

  11. Ant-egg cataract. An electron microscopic study

    DEFF Research Database (Denmark)

    Schrøder, H D; Nissen, S H

    1979-01-01

    an intermittent growth of the structure. In the ant-eggs, as well as in some areas separate from these, membrane limited cytoplasmic bodies could be seen in many cases, the membranes of which were partly joint and partly separated by an electron dense material. It is suggested that the calcifications seen...

  12. Examination of Graphene in a Scanning Low Energy Electron Microscope

    Czech Academy of Sciences Publication Activity Database

    Müllerová, Ilona; Mikmeková, Eliška; Frank, Luděk

    2015-01-01

    Roč. 21, S3 (2015), s. 29-30 ISSN 1431-9276 R&D Projects: GA MŠk(CZ) LO1212 Institutional support: RVO:68081731 Keywords : graphene * LEEM Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.730, year: 2015

  13. Electron energy loss spectroscopy microanalysis and imaging in the transmission electron microscope: example of biological applications

    International Nuclear Information System (INIS)

    Diociaiuti, Marco

    2005-01-01

    This paper reports original results obtained in our laboratory over the past few years in the application of both electron energy loss spectroscopy (EELS) and electron spectroscopy imaging (ESI) to biological samples, performed in two transmission electron microscopes (TEM) equipped with high-resolution electron filters and spectrometers: a Gatan model 607 single magnetic sector double focusing EEL serial spectrometer attached to a Philips 430 TEM and a Zeiss EM902 Energy Filtering TEM. The primary interest was on the possibility offered by the combined application of these spectroscopic techniques with those offered by the TEM. In particular, the electron beam focusing available in a TEM allowed us to perform EELS and ESI on very small sample volumes, where high-resolution imaging and electron diffraction techniques can provide important structural information. I show that ESI was able to improve TEM performance, due to the reduced chromatic aberration and the possibility of avoiding the sample staining procedure. Finally, the analysis of the oscillating extended energy loss fine structure (EXELFS) beyond the ionization edges characterizing the EELS spectra allowed me, in a manner very similar to the extended X-ray absorption fine structure (EXAFS) analysis of the X-ray absorption spectra, to obtain short-range structural information for such light elements of biological interest as O or Fe. The Philips EM430 (250-300 keV) TEM was used to perform EELS microanalysis on Ca, P, O, Fe, Al and Si. The assessment of the detection limits of this method was obtained working with well-characterized samples containing Ca and P, and mimicking the actual cellular matrix. I applied EELS microanalysis to Ca detection in bone tissue during the mineralization process and to P detection in the cellular membrane of erythrocytes treated with an anti-tumoral drug, demonstrating that the cellular membrane is a drug target. I applied EELS microanalysis and selected area electron

  14. Progress in x-ray microanalysis in the analytical electron microscope

    International Nuclear Information System (INIS)

    Williams, D.B.

    1987-01-01

    Analytical electron microscopes (AEM) consisting of x-ray energy dispersive spectrometers (EDS) interfaced to scanning transmission electron microscopes have been available for more than a decade. During that time, progress towards reaching the fundamental limits of the technique has been slow. The progress of x-ray microanalysis in AEM is examined in terms of x-ray detector technology; the EDS/AEM interface; accuracy of microanalysis; and spatial resolution and detectability limits. X-ray microanalysis in the AEM has substantial room for improvement in terms of the interface between the detector and the microscope. Advances in microscope design and software should permit 10nm resolution with detectability limits approaching 0.01wt percent. 16 refs., 2 figs., 1 tab

  15. A Simple Metric for Determining Resolution in Optical, Ion, and Electron Microscope Images.

    Science.gov (United States)

    Curtin, Alexandra E; Skinner, Ryan; Sanders, Aric W

    2015-06-01

    A resolution metric intended for resolution analysis of arbitrary spatially calibrated images is presented. By fitting a simple sigmoidal function to pixel intensities across slices of an image taken perpendicular to light-dark edges, the mean distance over which the light-dark transition occurs can be determined. A fixed multiple of this characteristic distance is then reported as the image resolution. The prefactor is determined by analysis of scanning transmission electron microscope high-angle annular dark field images of Si. This metric has been applied to optical, scanning electron microscope, and helium ion microscope images. This method provides quantitative feedback about image resolution, independent of the tool on which the data were collected. In addition, our analysis provides a nonarbitrary and self-consistent framework that any end user can utilize to evaluate the resolution of multiple microscopes from any vendor using the same metric.

  16. Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Joon Huang Chuah

    2011-01-01

    Full Text Available This paper presents a novel method of detecting secondary electrons generated in the scanning electron microscope (SEM. The method suggests that the photomultiplier tube (PMT, traditionally used in the Everhart-Thornley (ET detector, is to be replaced with a configurable multipixel solid-state photon detector offering the advantages of smaller dimension, lower supply voltage and power requirements, and potentially cheaper product cost. The design of the proposed detector has been implemented using a standard 0.35 μm CMOS technology with optical enhancement. This microchip comprises main circuit constituents of an array of photodiodes connecting to respective noise-optimised transimpedance amplifiers (TIAs, a selector-combiner (SC circuit, and a postamplifier (PA. The design possesses the capability of detecting photons with low input optical power in the range of 1 nW with 100 μm × 100 μm sized photodiodes and achieves a total amplification of 180 dBΩ at the output.

  17. The Physical Characterization of Liposome Salicylic Acid Using Transmission Electron Microscope

    International Nuclear Information System (INIS)

    Elman Panjaitan

    2008-01-01

    The physical characterization of liposome, formulated from salicylic acid using thin film hydration methods with cholesterol and soybean lecithin, has been done. The formula was characterized by optical microscopes and Transmission Electron Microscope (TEM). The observation result shows that the salicylic acid can be formulated to liposomes. Soybean lecithin combined with cholesterol (600 mg : 20 mg) was the best formula and the liposome was spherical vesicle like with dimension about 70 nm unit 800 nm. (author)

  18. Some applications of the high voltage electron microscope in physical metallurgy

    International Nuclear Information System (INIS)

    Regnier, P.; Thomas de Montpreville, C.

    1976-01-01

    The high voltage electron microscope (HVEM) is a microscope with a much higher penetration than the usual ones, as well as being a remarkable irradiation machine. The possible applications of the HVEM related to its advantages over the conventional microscopes are first discussed. The simultaneous use of the HVEM as an irradiation machine and an observation tool is then discussed, experiments carried in the laboratory being referred to. The last use of the HVEM makes it an irreplaceable tool for continuously following the clustering of irradiation defects [fr

  19. Microscopical Studies of Structural and Electronic Properties of Semiconductors

    CERN Multimedia

    2002-01-01

    The electronic and structural properties of point defects in semiconductors, e.g. radiation defects, impurities or passivating defects can excellently be studied by the hyperfine technique of Perturbed Angular Correlation (PAC). The serious limitation of this method, the small number of chemically different radioactive PAC probe atoms can be widely overcome by means of ISOLDE. Providing shortliving isotopes, which represent common dopants as well as suitable PAC probe atoms, the ISOLDE facility enables a much broader application of PAC to problems in semiconductor physics.\\\\ Using the probe atom $^{111m}$ Cd , the whole class of III-V compounds becomes accessible for PAC investigations. First successful experiments in GaAs, InP and GaP have been performed, concerning impurity complex formation and plasma induced defects. In Si and Ge, the electronic properties~-~especially their influence on acceptor-donor interaction~-~could be exemplarily st...

  20. Precision crystal alignment for high-resolution electron microscope imaging

    International Nuclear Information System (INIS)

    Wood, G.J.; Beeching, M.J.

    1990-01-01

    One of the more difficult tasks involved in obtaining quality high-resolution electron micrographs is the precise alignment of a specimen into the required zone. The current accepted procedure, which involves changing to diffraction mode and searching for symmetric point diffraction pattern, is insensitive to small amounts of misalignment and at best qualitative. On-line analysis of the fourier space representation of the image, both for determining and correcting crystal tilt, is investigated. 8 refs., 42 figs

  1. Practical Use of Scanning Low Energy Electron Microscope (SLEEM)

    Czech Academy of Sciences Publication Activity Database

    Müllerová, Ilona; Mikmeková, Eliška; Mikmeková, Šárka; Konvalina, Ivo; Frank, Luděk

    2016-01-01

    Roč. 22, S3 (2016), s. 1650-1651 ISSN 1431-9276 R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01 Institutional support: RVO:68081731 Keywords : scanning low energy * SLEEM Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.891, year: 2016

  2. Thinning of specimens for examination under the electron microscope

    International Nuclear Information System (INIS)

    Franks, J.

    1982-01-01

    Heretofore specimens have been thinned to penetration for examination by electron microscopy techniques, by ion erosion techniques. A more rapid technique is disclosed employing a beam or beams comprised solely of neutral particles. In tests carried out using this technique the sputtering rate from a sample specimen has been shown to be several percentages greater using a neutral source than from an ion source with the same flux density. (author)

  3. Electron microscopic analysis of rotavirus assembly-replication intermediates

    International Nuclear Information System (INIS)

    Boudreaux, Crystal E.; Kelly, Deborah F.; McDonald, Sarah M.

    2015-01-01

    Rotaviruses (RVs) replicate their segmented, double-stranded RNA genomes in tandem with early virion assembly. In this study, we sought to gain insight into the ultrastructure of RV assembly-replication intermediates (RIs) using transmission electron microscopy (EM). Specifically, we examined a replicase-competent, subcellular fraction that contains all known RV RIs. Three never-before-seen complexes were visualized in this fraction. Using in vitro reconstitution, we showed that ~15-nm doughnut-shaped proteins in strings were nonstructural protein 2 (NSP2) bound to viral RNA transcripts. Moreover, using immunoaffinity-capture EM, we revealed that ~20-nm pebble-shaped complexes contain the viral RNA polymerase (VP1) and RNA capping enzyme (VP3). Finally, using a gel purification method, we demonstrated that ~30–70-nm electron-dense, particle-shaped complexes represent replicase-competent core RIs, containing VP1, VP3, and NSP2 as well as capsid proteins VP2 and VP6. The results of this study raise new questions about the interactions among viral proteins and RNA during the concerted assembly–replicase process. - Highlights: • Rotaviruses replicate their genomes in tandem with early virion assembly. • Little is known about rotavirus assembly-replication intermediates. • Assembly-replication intermediates were imaged using electron microscopy

  4. Electron microscopic analysis of rotavirus assembly-replication intermediates

    Energy Technology Data Exchange (ETDEWEB)

    Boudreaux, Crystal E.; Kelly, Deborah F. [Virginia Tech Carilion School of Medicine and Research Institute, Roanoke, VA (United States); McDonald, Sarah M., E-mail: mcdonaldsa@vtc.vt.edu [Virginia Tech Carilion School of Medicine and Research Institute, Roanoke, VA (United States); Department of Biomedical Sciences and Pathobiology, Virginia—Maryland Regional College of Veterinary Medicine, Blacksburg, VA (United States)

    2015-03-15

    Rotaviruses (RVs) replicate their segmented, double-stranded RNA genomes in tandem with early virion assembly. In this study, we sought to gain insight into the ultrastructure of RV assembly-replication intermediates (RIs) using transmission electron microscopy (EM). Specifically, we examined a replicase-competent, subcellular fraction that contains all known RV RIs. Three never-before-seen complexes were visualized in this fraction. Using in vitro reconstitution, we showed that ~15-nm doughnut-shaped proteins in strings were nonstructural protein 2 (NSP2) bound to viral RNA transcripts. Moreover, using immunoaffinity-capture EM, we revealed that ~20-nm pebble-shaped complexes contain the viral RNA polymerase (VP1) and RNA capping enzyme (VP3). Finally, using a gel purification method, we demonstrated that ~30–70-nm electron-dense, particle-shaped complexes represent replicase-competent core RIs, containing VP1, VP3, and NSP2 as well as capsid proteins VP2 and VP6. The results of this study raise new questions about the interactions among viral proteins and RNA during the concerted assembly–replicase process. - Highlights: • Rotaviruses replicate their genomes in tandem with early virion assembly. • Little is known about rotavirus assembly-replication intermediates. • Assembly-replication intermediates were imaged using electron microscopy.

  5. Photoemission study of K on graphite

    NARCIS (Netherlands)

    Bennich, P.; Puglia, C.; Brühwiler, P.A.; Nilsson, A.; Sandell, A.; Mårtensson, N.; Rudolf, P.

    1999-01-01

    The physical and electronic structure of the dispersed and (2×2) phases of K/graphite have been characterized by valence and core-level photoemission. Charge transfer from K to graphite is found to occur at all coverages, and includes transfer of charge to the second graphite layer. A rigid band

  6. Direct angle resolved photoemission spectroscopy and ...

    Indian Academy of Sciences (India)

    Since 1997 we systematically perform direct angle resolved photoemission spectroscopy (ARPES) on in-situ grown thin (< 30 nm) cuprate films. Specifically, we probe low-energy electronic structure and properties of high-c superconductors (HTSC) under different degrees of epitaxial (compressive vs. tensile) strain.

  7. Development of an environmental high-voltage electron microscope for reaction science.

    Science.gov (United States)

    Tanaka, Nobuo; Usukura, Jiro; Kusunoki, Michiko; Saito, Yahachi; Sasaki, Katuhiro; Tanji, Takayoshi; Muto, Shunsuke; Arai, Shigeo

    2013-02-01

    Environmental transmission electron microscopy and ultra-high resolution electron microscopic observation using aberration correctors have recently emerged as topics of great interest. The former method is an extension of the so-called in situ electron microscopy that has been performed since the 1970s. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Since 2007, Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope that can be used to observe nanomaterials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nanometre-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy. The new instrument has been used to image and analyse various types of samples including biological ones.

  8. Transmission electron microscopic study of reduced Ca2UO5

    International Nuclear Information System (INIS)

    Krasevec, V.; Prodan, A.; Holc, J.; Kolar, D.

    1983-01-01

    Structural changes of Ca 2 UO 5 during reduction in hydrogen were studied by transmission electron microscopy. It was shown that monoclinic Ca 2 UO 5 changes into triclinic Ca 4 U 2 O 9 . They are related, respectively, to the fluorite and the bixbyite (C-M 2 O 3 ) structures, so that the product is a superstructure of the latter. Reduction occurs along the (100)/sub t/ planes originating from the (006)/sub m/ planes of the parent structure by diminishing the coordination number of the Ca cation from 7 to 6. 5 figures

  9. Growth optimization and electronic structure of ultrathin CoO films on Ag(001): A LEED and photoemission study

    Science.gov (United States)

    Barman, Sukanta; Menon, Krishnakumar S. R.

    2018-04-01

    We present here a detailed growth optimization of CoO thin film on Ag(001) involving the effects of different growth parameters on the electronic structure. A well-ordered stoichiometric growth of 5 ML CoO film has been observed at 473 K substrate temperature and 1 × 10-6 mbar oxygen partial pressure. The growth at lower substrate temperature and oxygen partial pressure show non-stoichiometric impurity phases which have been investigated further to correlate the growth parameters with surface electronic structure. The coverage dependent valence band electronic structure of the films grown at optimized condition reveals the presence of interfacial states near the Fermi edge (EF) for lower film coverages. Presence of interfacial states in the stoichiometric films rules out their defect-induced origin. We argue that this is an intrinsic feature of transition metal monoxides like NiO, CoO, MnO in the low coverage regime.

  10. Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study

    Science.gov (United States)

    Avila, José; Razado, Ivy; Lorcy, Stéphane; Fleurier, Romain; Pichonat, Emmanuelle; Vignaud, Dominique; Wallart, Xavier; Asensio, María C.

    2013-01-01

    The ability to produce large, continuous and defect free films of graphene is presently a major challenge for multiple applications. Even though the scalability of graphene films is closely associated to a manifest polycrystalline character, only a few numbers of experiments have explored so far the electronic structure down to single graphene grains. Here we report a high resolution angle and lateral resolved photoelectron spectroscopy (nano-ARPES) study of one-atom thick graphene films on thin copper foils synthesized by chemical vapor deposition. Our results show the robustness of the Dirac relativistic-like electronic spectrum as a function of the size, shape and orientation of the single-crystal pristine grains in the graphene films investigated. Moreover, by mapping grain by grain the electronic dynamics of this unique Dirac system, we show that the single-grain gap-size is 80% smaller than the multi-grain gap recently reported by classical ARPES. PMID:23942471

  11. Scanning Electron Microscopic Hair Shaft Analysis in Ectodermal Dysplasia Syndromes.

    Science.gov (United States)

    Hirano-Ali, Stefanie A; Reed, Ashley M; Rowan, Brandon J; Sorrells, Timothy; Williams, Judith V; Pariser, David M; Hood, Antoinette F; Salkey, Kimberly

    2015-01-01

    The objective of the current study was to catalog hair shaft abnormalities in individuals with ectodermal dysplasia (ED) syndromes using scanning electron microscopy (SEM) and to compare the findings with those in unaffected controls. This is the second of a two-part study, the first of which used light microscopy as the modality and was previously published. Scanning electron microscopy was performed in a blinded manner on hair shafts from 65 subjects with seven types of ED syndromes and 41 unaffected control subjects. Assessment was performed along the length of the shaft and in cross section. Hair donations were collected at the 28th Annual National Family Conference held by the National Foundation for Ectodermal Dysplasia. Control subjects were recruited from a private dermatology practice and an academic children's hospital outpatient dermatology clinic. SEM identified various pathologic hair shaft abnormalities in each type of ED and in control patients. When hairs with all types of ED were grouped together and compared with those of control patients, the difference in the presence of small diameter and shallow and deep grooves was statistically significant (p < 0.05). When the EDs were separated according to subtype, statistically significant findings were also seen. SEM is a possible adjuvant tool in the diagnosis of ED syndromes. There are significant differences, with high specificity, between the hairs of individuals with ED and those of control subjects and between subtypes. © 2015 Wiley Periodicals, Inc.

  12. High-resolution imaging in the scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Pennycook, S.J.; Jesson, D.E.

    1992-03-01

    The high-resolution imaging of crystalline materials in the scanning transmission electron microscopy (STEM) is reviewed with particular emphasis on the conditions under which an incoherent image can be obtained. It is shown that a high-angle annular detector can be used to break the coherence of the imaging process, in the transverse plane through the geometry of the detector, or in three dimensions if multiphonon diffuse scattering is detected. In the latter case, each atom can be treated as a highly independent source of high-angle scattering. The most effective fast electron states are therefore tightly bound s-type Bloch states. Furthermore, they add constructively for each incident angle in the coherent STEM probe, so that s states are responsible for practically the entire image contrast. Dynamical effects are largely removed, and almost perfect incoherent imaging is achieved. s states are relatively insensitive to neighboring strings, so that incoherent imaging is maintained for superlattice and interfaces, and supercell calculations are unnecessary. With an optimum probe profile, the incoherent image represents a direct image of the crystal projection, with compositional sensitivity built in through the strong dependence of the scattering cross sections on atomic number Z

  13. Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

    Science.gov (United States)

    Jones, L; Nellist, P D

    2014-05-01

    In the scanning transmission electron microscope, hardware aberration correctors can now correct for the positive spherical aberration of round electron lenses. These correctors make use of nonround optics such as hexapoles or octupoles, leading to the limiting aberrations often being of a nonround type. Here we explore the effect of a number of potential limiting aberrations on the imaging performance of the scanning transmission electron microscope through their resulting optical transfer functions. In particular, the response of the optical transfer function to changes in defocus are examined, given that this is the final aberration to be tuned just before image acquisition. The resulting three-dimensional optical transfer functions also allow an assessment of the performance of a system for focal-series experiments or optical sectioning applications. © 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.

  14. Dual ion beam irradiation system for in situ observation with electron microscope

    International Nuclear Information System (INIS)

    Tsukamoto, Tetuo; Hojou, Kiiti; Furuno, Sigemi; Otsu, Hitosi; Izui, Kazuhiko.

    1993-01-01

    We have developed a new in situ observation system for dynamic processes under dual ion beam irradiation. The system consists of a modified 400 keV analytical electron microscope (JEOL, JEM-4000FX) and two 40 kV ion beam accelerators. This system allows evaluation of microscopic changes of structure and chemical bonding state of materials in the dynamic processes under two kinds of ion beam irradiations, that is required for the simulation test of the first wall of nuclear fusion reactors onto which He + , H + , and H 2 + ions are irradiated simultaneously. These two ion accelerators were equipped symmetrically both sides of the electron microscope and individually controlled. Each ion beam extracted from a duo-plasmatron ion gun is bent downward by an angle of 30deg with a mass-separating magnet, and introduced into specimen chamber of the electron microscope. Inside the specimen chamber the beam is deflected again by an angle of 30deg with an electrostatic prism so as to be incident on the specimen surface. Finally, two ion beams from both side are incident on the specimen surface at an angle of 60deg. The maximum ion current density of helium is more than 250μA/cm 2 at the specimen at an ion energy of 17 keV. Images of the electron microscope during dual ion beam irradiation are observed through a TV camera and recorded with a VTR. (author)

  15. Photoemission using femtosecond laser pulses

    International Nuclear Information System (INIS)

    Srinivasan-Rao, T.; Tsang, T.; Fischer, J.

    1991-10-01

    Successful operation of short wavelength FEL requires an electron bunch of current >100 A and normalized emittance < 1 mm-mrad. Recent experiments show that RF guns with photocathodes as the electron source may be the ideal candidate for achieving these parameters. To reduce the emittance growth due to space charge and RF dynamics effects, the gun may have to operate at high field gradient (hence at high RF frequency) and a spot size small compared to the aperture. This may necessitate the laser pulse duration to be in the subpicosecond regime to reduce the energy spread. We will present the behavior of metal photocathodes upon irradiation with femtosecond laser beams, comparison of linear and nonlinear photoemission, and scalability to high currents. Theoretical estimate of the intrinsic emittance at the photocathode in the presence of the anomalous heating of the electrons, and the tolerance on the surface roughness of the cathode material will be discussed

  16. Electron microscope observation of single - crystalline beryllium thin foils

    International Nuclear Information System (INIS)

    Antolin, J.; Poirier, J.P.; Dupouy, J.M.

    1965-01-01

    Thin foils prepared from single crystalline beryllium simples deformed at room temperature, have been observed by transmission electron microscopy. The various deformation modes have been investigated separately, from their early stages and their characteristic dislocation configurations have been observed. Basal slip is characterized at is outset by the presence of numerous dipoles and elongated prismatic loops. More pronounced cold work leads to the formation of dislocation tangles and bundles which eventually give a cellular structure. Prismatic slip begins by the cross-slip of dislocations from the basal plane into the prismatic plane. A cellular structure is equally observed in heavily deformed samples. Sessile dislocations have been observed in twin boundaries; they are produced by reactions between slip dislocations and twin dislocations. Finally, the study of samples quenched from 1100 deg. C and annealed at 200 deg. C has shown that the observed loops lie in prismatic planes and have a Burgers vector b 1/3 . (authors) [fr

  17. Transmission electron microscope cells for use with liquid samples

    Science.gov (United States)

    Khalid, Waqas; Alivisatos, Paul A.; Zettl, Alexander K.

    2016-08-09

    This disclosure provides systems, methods, and devices related to transmission electron microscopy cells for use with liquids. In one aspect a device includes a substrate, a first graphene layer, and a second graphene layer. The substrate has a first surface and a second surface. The first surface defines a first channel, a second channel, and an outlet channel. The first channel and the second channel are joined to the outlet channel. The outlet channel defines a viewport region forming a though hole in the substrate. The first graphene layer overlays the first surface of the substrate, including an interior area of the first channel, the second channel, and the outlet channel. The second graphene layer overlays the first surface of the substrate, including open regions defined by the first channel, the second channel, and the outlet channel.

  18. A video-amplifier device for the transmission-type electron microscope ELMISCOP I of Siemens

    International Nuclear Information System (INIS)

    Groboth, G.; Hoerl, E.M.

    1975-01-01

    In order to get a visual image of the sample at the final screen of a transmission-type electron microscope and to keep at the same time the sample at low temperature a video-amplifier device has been developed by the authors. Details about its design and the necessary reconstruction of the electron microscope equipment are given. The beam current density at the transparent screen is reduced to 10 -12 -10 -13 A.cm -2 . Moreover the costs of this video-amplifier device are lower than those available. (CR)

  19. Visualizing Morphological Changes of Abscission Zone Cells in Arabidopsis by Scanning Electron Microscope.

    Science.gov (United States)

    Shi, Chun-Lin; Butenko, Melinka A

    2018-01-01

    Scanning electron microscope (SEM) is a type of electron microscope which produces detailed images of surface structures. It has been widely used in plants and animals to study cellular structures. Here, we describe a detailed protocol to prepare samples of floral abscission zones (AZs) for SEM, as well as further image analysis. We show that it is a powerful tool to detect morphologic changes at the cellular level during the course of abscission in wild-type plants and to establish the details of phenotypic alteration in abscission mutants.

  20. Scanning tunnelling microscope imaging of nanoscale electron density gradients on the surface of GaAs

    International Nuclear Information System (INIS)

    Hamilton, B; Jacobs, J; Missous, M

    2003-01-01

    This paper is concerned with the scanning tunnelling microscope tunnelling conditions needed to produce constant current images dominated either by surface topology or by electronic effects. A model experimental structure was produced by cleaving a GaAs multiδ-doped layer in UHV and so projecting a spatially varying electron gas density onto the (110) surface. This cross sectional electron density varies on a nanometre scale in the [100] growth direction. The electronic structure and tunnelling properties of this system were modelled, and the tunnelling conditions favouring sensitivity to the surface electron gas density determined

  1. Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope

    International Nuclear Information System (INIS)

    Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D.; Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka; Shimojo, Masayuki

    2010-01-01

    We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

  2. An investigation of the electron irradiation of graphite in a helium atmosphere using a modified electron microscope

    International Nuclear Information System (INIS)

    Burden, A.P.; Hutchison, J.L.

    1997-01-01

    The behaviour of graphite particles immersed in helium gas and irradiated with an electron-beam has been investigated. Because this treatment was performed in a modified high resolution transmission electron microscope, the rapid morphological and microstructural changes that occurred could be directly observed. The results have implications for future controlled environment microscopy of carbonaceous materials and the characterisation of such microscopes. It is also shown that the processes can provide insight into ion-irradiation induced damage of graphite and the mechanism of fullerene generation. (Author)

  3. Damage-free vibrational spectroscopy of biological materials in the electron microscope.

    Science.gov (United States)

    Rez, Peter; Aoki, Toshihiro; March, Katia; Gur, Dvir; Krivanek, Ondrej L; Dellby, Niklas; Lovejoy, Tracy C; Wolf, Sharon G; Cohen, Hagai

    2016-03-10

    Vibrational spectroscopy in the electron microscope would be transformative in the study of biological samples, provided that radiation damage could be prevented. However, electron beams typically create high-energy excitations that severely accelerate sample degradation. Here this major difficulty is overcome using an 'aloof' electron beam, positioned tens of nanometres away from the sample: high-energy excitations are suppressed, while vibrational modes of energies electron energy loss spectra from biogenic guanine crystals in their native state, resolving their characteristic C-H, N-H and C=O vibrational signatures with no observable radiation damage. The technique opens up the possibility of non-damaging compositional analyses of organic functional groups, including non-crystalline biological materials, at a spatial resolution of ∼10 nm, simultaneously combined with imaging in the electron microscope.

  4. Electron Microscopic Visualization of Protein Assemblies on Flattened DNA Origami.

    Science.gov (United States)

    Mallik, Leena; Dhakal, Soma; Nichols, Joseph; Mahoney, Jacob; Dosey, Anne M; Jiang, Shuoxing; Sunahara, Roger K; Skiniotis, Georgios; Walter, Nils G

    2015-07-28

    DNA provides an ideal substrate for the engineering of versatile nanostructures due to its reliable Watson-Crick base pairing and well-characterized conformation. One of the most promising applications of DNA nanostructures arises from the site-directed spatial arrangement with nanometer precision of guest components such as proteins, metal nanoparticles, and small molecules. Two-dimensional DNA origami architectures, in particular, offer a simple design, high yield of assembly, and large surface area for use as a nanoplatform. However, such single-layer DNA origami were recently found to be structurally polymorphous due to their high flexibility, leading to the development of conformationally restrained multilayered origami that lack some of the advantages of the single-layer designs. Here we monitored single-layer DNA origami by transmission electron microscopy (EM) and discovered that their conformational heterogeneity is dramatically reduced in the presence of a low concentration of dimethyl sulfoxide, allowing for an efficient flattening onto the carbon support of an EM grid. We further demonstrated that streptavidin and a biotinylated target protein (cocaine esterase, CocE) can be captured at predesignated sites on these flattened origami while maintaining their functional integrity. Our demonstration that protein assemblies can be constructed with high spatial precision (within ∼2 nm of their predicted position on the platforms) by using strategically flattened single-layer origami paves the way for exploiting well-defined guest molecule assemblies for biochemistry and nanotechnology applications.

  5. Electron microscopic examination of uncultured soil-dwelling bacteria.

    Science.gov (United States)

    Amako, Kazunobu; Takade, Akemi; Taniai, Hiroaki; Yoshida, Shin-ichi

    2008-05-01

    Bacteria living in soil collected from a rice paddy in Fukuoka, Japan, were examined by electron microscopy using a freeze-substitution fixation method. Most of the observed bacteria could be categorized, based on the structure of the cell envelope and overall morphology, into one of five groups: (i) bacterial spore; (ii) Gram-positive type; (iii) Gram-negative type; (iv) Mycobacterium like; and (v) Archaea like. However, a few of the bacteria could not be readily categorized into one of these groups because they had unique cell wall structures, basically resembling those of Gram-negative bacteria, but with the layer corresponding to the peptidoglycan layer in Gram-negative bacteria being extremely thick, like that of the cortex of a bacterial spore. The characteristic morphological features found in many of these uncultured, soil-dwelling cells were the nucleoid being in a condensed state and the cytoplasm being shrunken. We were able to produce similar morphologies in vitro using a Salmonella sp. by culturing under low-temperature, low-nutrient conditions, similar to those found in some natural environments. These unusual morphologies are therefore hypothesized to be characteristic of bacteria in resting or dormant stages.

  6. In situ fatigue loading stage inside scanning electron microscope

    Science.gov (United States)

    Telesman, Jack; Kantzos, Peter; Brewer, David

    1988-01-01

    A fatigue loading stage inside a scanning electron microscopy (SEM) was developed. The stage allows dynamic and static high-magnification and high-resolution viewing of the fatigue crack initiation and crack propagation processes. The loading stage is controlled by a closed-loop servohydraulic system. Maximum load is 1000 lb (4450 N) with test frequencies ranging up to 30 Hz. The stage accommodates specimens up to 2 inches (50 mm) in length and tolerates substantial specimen translation to view the propagating crack. At room temperature, acceptable working resolution is obtainable for magnifications ranging up to 10,000X. The system is equipped with a high-temperature setup designed for temperatures up to 2000 F (1100 C). The signal can be videotaped for further analysis of the pertinent fatigue damage mechanisms. The design allows for quick and easy interchange and conversion of the SEM from a loading stage configuration to its normal operational configuration and vice versa. Tests are performed entirely in the in-situ mode. In contrast to other designs, the NASA design has greatly extended the life of the loading stage by not exposing the bellows to cyclic loading. The loading stage was used to investigate the fatigue crack growth mechanisms in the (100)-oriented PWA 1480 single-crystal, nickel-based supperalloy. The high-magnification observations revealed the details of the crack growth processes.

  7. Classification of heterogeneous electron microscopic projections into homogeneous subsets

    International Nuclear Information System (INIS)

    Herman, G.T.; Kalinowski, M.

    2008-01-01

    The co-existence of different states of a macromolecular complex in samples used by three-dimensional electron microscopy (3D-EM) constitutes a serious challenge. The single particle method applied directly to such heterogeneous sets is unable to provide useful information about the encountered conformational diversity and produces reconstructions with severely reduced resolution. One approach to solving this problem is to partition heterogeneous projection set into homogeneous components and apply existing reconstruction techniques to each of them. Due to the nature of the projection images and the high noise level present in them, this classification task is difficult. A method is presented to achieve the desired classification by using a novel image similarity measure and solving the corresponding optimization problem. Unlike the majority of competing approaches, the presented method employs unsupervised classification (it does not require any prior knowledge about the objects being classified) and does not involve a 3D reconstruction procedure. We demonstrate a fast implementation of this method, capable of classifying projection sets that originate from 3D-EM. The method's performance is evaluated on synthetically generated data sets produced by projecting 3D objects that resemble biological structures

  8. Design for an aberration corrected scanning electron microscope using miniature electron mirrors.

    Science.gov (United States)

    Dohi, Hideto; Kruit, Pieter

    2018-06-01

    Resolution of scanning electron microscopes (SEMs) is determined by aberrations of the objective lens. It is well known that both spherical and chromatic aberrations can be compensated by placing a 90-degree bending magnet and an electron mirror in the beam path before the objective lens. Nevertheless, this approach has not led to wide use of these aberration correctors, partly because aberrations of the bending magnet can be a serious problem. A mirror corrector with two mirrors placed perpendicularly to the optic axis of an SEM and facing each other is proposed. As a result, only small-angle magnetic deflection is necessary to guide the electron beam around the top mirror to the bottom mirror and around the bottom mirror to the objective lens. The deflection angle, in the order of 50 mrad, is sufficiently small to avoid deflection aberrations. In addition, lateral dispersion at the sample plane can be avoided by making the deflection fields symmetric. Such a corrector system is only possible if the incoming beam can pass the top mirror at a distance in the order of millimeters, without being disturbed by the electric fields of electrodes of the mirror. It is proposed that condition can be satisfied with micro-scale electron optical elements fabricated by using MEMS technology. In the proposed corrector system, the micro-mirrors have to provide the exact negative spherical and chromatic aberrations for correcting the aberration of the objective lens. This exact tuning is accomplished by variable magnification between the micro-mirrors and the objective lens using an additional transfer lens. Extensive optical calculations are reported. Aberrations of the micro-mirrors were analyzed by numerical calculation. Dispersion and aberrations of the deflectors were calculated by using an analytical field model. Combination aberrations caused by the off-axis position of dispersive rays in the mirrors and objective lens were also analyzed. It is concluded that the proposed

  9. Photoemission and low energy electron microscopy study on the formation and nitridation of indium droplets on Si (111)7 × 7 surfaces

    International Nuclear Information System (INIS)

    Qi, B.; Ólafsson, S.; Göthelid, M.; Gislason, H.P.; Agnarsson, B.

    2013-01-01

    The formation and nitridation of indium (In) droplets on Si (111)7 × 7, with regard to In droplet epitaxy growth of InN nanostructures, were studied using a spectroscopic photoemission and low energy electron microscopy, for the In coverages from 0.07 to 2.3 monolayer (ML). The results reveal that the In adatoms formed well-ordered clusters while keeping the Si (111)7 × 7 surface periodicity at 0.07 ML and a single √(3)×√(3) phase at 0.3 ML around 440–470 °C. At 0.82 ML, owing to the presence of structurally defect areas beside the 7 × 7 domains, 3-D In droplets evolved concomitantly with the formation of 4 × 1-In cluster chains, accompanied by a transition in surface electric property from semiconducting to metallic. Further increasing the In to 2.3 ML led to a moderate increase in number density and an appreciable lateral growth of the droplets, as well as the multi-domain In phases. Upon nitridation with NH 3 at ∼ 480 °C, besides the nitridation of the In droplets, the N radicals also dissociated the In-Si bonds to form Si-N. This caused a partial disintegration of the ordered In phase and removal of the In adatoms between the In droplets. - Highlights: ► Formation and nitridation of indium (In) droplets on Si (111) were studied. ► In droplets evolved with the 4 × 1-In cluster chains at 0.82 monolayer (ML). ► In droplets grow in density and lateral size with In coverage increased to 2.3 ML. ► The multi-domain In phases were formed at 2.3 ML. ► Nitridation of In droplets is accompanied by a disintegration of layering In phase

  10. Choice of operating voltage for a transmission electron microscope

    International Nuclear Information System (INIS)

    Egerton, R.F.

    2014-01-01

    An accelerating voltage of 100–300 kV remains a good choice for the majority of TEM or STEM specimens, avoiding the expense of high-voltage microscopy but providing the possibility of atomic resolution even in the absence of lens-aberration correction. For specimens thicker than a few tens of nm, the image intensity and scattering contrast are likely to be higher than at lower voltage, as is the visibility of ionization edges below 1000 eV (as required for EELS elemental analysis). In thick (>100 nm) specimens, higher voltage ensures less beam broadening and better spatial resolution for STEM imaging and EDX spectroscopy. Low-voltage (e.g. 30 kV) TEM or STEM is attractive for a very thin (e.g. 10 nm) specimen, as it provides higher scattering contrast and fewer problems for valence-excitation EELS. Specimens that are immune to radiolysis suffer knock-on damage at high current densities, and this form of radiation damage can be reduced or avoided by choosing a low accelerating voltage. Low-voltage STEM with an aberration-corrected objective lens (together with a high-angle dark-field detector and/or EELS) offers atomic resolution and elemental identification from very thin specimens. Conventional TEM can provide atomic resolution in low-voltage phase-contrast images but requires correction of chromatic aberration and preferably an electron-beam monochromator. Many non-conducting (e.g. organic) specimens damage easily by radiolysis and radiation damage then determines the TEM image resolution. For bright-field scattering contrast, low kV can provide slightly better dose-limited resolution if the specimen is very thin (a few nm) but considerably better resolution is possible from a thicker specimen, for which higher kV is required. Use of a phase plate in a conventional TEM offers the most dose-efficient way of achieving atomic resolution from beam-sensitive specimens. - Highlights: • 100–300 kV accelerating voltage is suitable for TEM specimens of typical

  11. The electronic structure of clean and adsorbate-covered Bi2Se3: an angle-resolved photoemission study

    DEFF Research Database (Denmark)

    Bianchi, Marco; Hatch, Richard; Guan, Dandan

    2012-01-01

    Angle-resolved photoelectron spectroscopy is used for a detailed study of the electronic structure of the topological insulator Bi2Se3. Nominally stoichiometric and calcium-doped samples were investigated. The pristine surface shows the topological surface state in the bulk band gap. As time passes....... For a sufficiently strong band bending, additional states appear at the Fermi level. These are interpreted as quantized conduction band states. For large band bendings, these states are found to undergo a strong Rashba splitting. The formation of quantum well states is also observed for the valence band states......, the Dirac point moves to higher binding energies, indicating an increasingly strong downward bending of the bands near the surface. This time-dependent band bending is related to a contamination of the surface and can be accelerated by intentionally exposing the surface to carbon monoxide and other species...

  12. Ambient pressure photoemission spectroscopy of metal surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Baikie, Iain D., E-mail: iain@kptechnology.ltd.uk; Grain, Angela C.; Sutherland, James; Law, Jamie

    2014-12-30

    Highlights: • Ambient pressure photoemission spectroscopy of metals. • Rastered photon energy scan overcomes inelastic scattering. • Relationship between photoemission threshold and contact potential difference. - Abstract: We describe a novel photoemission technique utilizing a traditional Kelvin probe as a detector of electrons/atmospheric ions ejected from metallic surfaces (Au, Ag, Cu, Fe, Ni, Ti, Zn, Al) illuminated by a deep ultra-violet (DUV) source under ambient pressure. To surmount the limitation of electron scattering in air the incident photon energy is rastered rather than applying a variable retarding electric field as is used with UPS. This arrangement can be applied in several operational modes: using the DUV source to determine the photoemission threshold (Φ) with 30–50 meV resolution and also the Kelvin probe, under dark conditions, to measure contact potential difference (CPD) between the Kelvin probe tip and the metallic sample with an accuracy of 1–3 meV. We have studied the relationship between the photoelectric threshold and CPD of metal surfaces cleaned in ambient conditions. Inclusion of a second spectroscopic visible source was used to confirm a semiconducting oxide, possibly Cu{sub 2}O, via surface photovoltage measurements with the KP. This dual detection system can be easily extended to controlled gas conditions, relative humidity control and sample heating/cooling.

  13. Dynamic Low-Vacuum Scanning Electron Microscope Freeze Drying Observation for Fresh Water Algae

    International Nuclear Information System (INIS)

    Mohsen, H.T.; Ghaly, W.A.; Zahran, N.F.; Helal, A.I.

    2010-01-01

    A new perpetration method for serving in dynamic examinations of the fresh water algae is developed in connection with the Low-Vacuum Scanning Electron Microscope (LV-SEM) freeze drying technique. Specimens are collected from fresh water of Ismailia channel then transferred directly to freeze by liquid nitrogen and dried in the chamber of the scanning electron microscope in the low vacuum mode. Scanning electron micrographs revealed that the drying method presented the microstructure of algae. Dehydration in a graded ethanol series is not necessary in the new method. Dried algae specimen is observed in SEM high vacuum mode after conductive coating at higher resolution. Low-vacuum SEM freeze drying technique is a simple, time-saving and reproducible method for scanning electron microscopy that is applicable to various aquatic microorganisms covered with soft tissues.

  14. APPLICATION OF SCANNING ELECTRON MICROSCOPE EQUIPPED WITH THE MICROANALYSIS SYSTEM FOR INVESTIGATION OF BRASS COVERING

    Directory of Open Access Journals (Sweden)

    T. P. Kurenkova

    2010-01-01

    Full Text Available The possibilities of application of scanning electronic microscope equipped with microanalysis system for investigation of the brass covering quality by slug for production of wire and metal cord particularly of change of copper concentration by covering thickness and slug perimeter, revealing of ?-phase allocation presence and character, determination of defect reasons, are shown.

  15. Practical application of HgI2 detectors to a space-flight scanning electron microscope

    Science.gov (United States)

    Bradley, J. G.; Conley, J. M.; Albee, A. L.; Iwanczyk, J. S.; Dabrowski, A. J.

    1989-01-01

    Mercuric iodide X-ray detectors have been undergoing tests in a prototype scanning electron microscope system being developed for unmanned space flight. The detector program addresses the issues of geometric configuration in the SEM, compact packaging that includes separate thermoelectric coolers for the detector and FET, X-ray transparent hermetic encapsulation and electrical contacts, and a clean vacuum environment.

  16. Characterization of calcium crystals in Abelia using x-ray diffraction and electron microscopes

    Science.gov (United States)

    Localization, chemical composition, and morphology of calcium crystals in leaves and stems of Abelia mosanensis and A. ×grandiflora were analyzed with a variable pressure scanning electron microscope (VP-SEM) equipped with an X-ray diffraction system, low temperature SEM (LT-SEM) and a transmission ...

  17. Minimal exposure technique in the Cambridge University 600kV high resolution electron microscope

    International Nuclear Information System (INIS)

    Fryer, J.R.; Cleaver, J.R.A.; Smith, D.J.

    1980-01-01

    Radiation damage due to the incident electron beam imposes a fundamental limitation on the information obtainable by electron microscopy about organic materials; it is desirable therefore that exposure of the specimen to the electron beam should be restricted to the actual period during which the image is being recorded. A description is given of methods employed in the observation of the organic aromatic hydrocarbons quaterrylene, ovalene and coronene with the Cambridge University 600kV high resolution electron microscope (HREM). In particular, the condenser-objective mode of operation of this microscope lends itself to the use of an area-defining aperture below the second condenser lens conjugate with the specimen. Furthermore, operation at the higher accelerating voltage of this instrument could be anticipated to reduce the rate of damage, depending on the dominant beam-specimen interaction, whilst the increased width of the first broad band of the contrast transfer function of this microscope at the optimum defocus may overcome the reported resolution limitation of current 100kV microscopes for the observation of related materials. (author)

  18. Theory of life time measurements with the scanning electron microscope: steady state

    NARCIS (Netherlands)

    Berz, F.; Kuiken, H.K.

    1976-01-01

    A theoretical steady state analysis is given of the scanning electron microscope method of measuring bulk life time in diodes, where the plane of the junction is perpendicular to the surface. The current in the junction is obtained as a function of the beam power, the beam penetration into the

  19. Molecular frame photoemission: a probe of electronic/nuclear photo-dynamics and polarization state of the ionizing light

    International Nuclear Information System (INIS)

    Veyrinas, Kevin

    2015-01-01

    This is thesis is dedicated to the study and the use of the remarkable properties of the molecular frame photoelectron angular distribution (MFPAD). This observable is a very sensitive probe of both the photoionization (PI) processes in small molecules, through the determination of the magnitudes and relative phases of the dipole matrix elements, and the polarization state of the ionizing light, which is entirely encoded in the MFPAD in terms of the Stokes parameters (s1, s2, s3). MFPAD measurements take advantage of dissociative photoionization (DPI) processes by combining an electron-ion 3D momentum spectroscopy technique with the use of different radiation facilities: SOLEIL synchrotron (DESIRS and PLEIADES beamlines) and the XUV PLFA beamline (SLIC, LIDyL Attophysics group, CEA Saclay) based on the interaction of a strong laser field with a gaseous target called high harmonic generation (HHG). The first part of the thesis is devoted to the complete characterization of the polarization state of an incoming radiation. In this context, an original 'molecular polarimetry' method is introduced and demonstrated by comparison with a VUV optical polarimeter available on the DESIRS beamline. Using this method to determine the full polarization ellipse of HHG radiation generated in different conditions on the XUV PLFA facility leads to original results that include the challenging disentanglement of the circular and unpolarized components of the studied radiation. The second part deals with the study of DPI of the H 2 , D 2 and HD molecules induced by circularly polarized light at resonance with the doubly excited states Q1 and Q2. In this energy region (30-35 eV) where direct ionization, autoionization and dissociation compete on a femtosecond timescale, the photonic excitation gives rise to complex ultrafast electronic and nuclear coupled dynamics. The remarkable asymmetries observed in the circular dichroism in the molecular frame, compared to quantum

  20. Facilities for in situ ion beam studies in transmission electron microscopes

    International Nuclear Information System (INIS)

    Allen, C.W.; Ohnuki, S.; Takahashi, H.

    1993-08-01

    Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and electron diffraction from very small regions to be employed during ion-irradiation effects studies. At present there are ten such installations in Japan, one in France and one in the USA. General specifications of facilities which are operational in 1993 are summarized, and additional facilities which are planned or being proposed are briefly described

  1. A design for a subminiature, low energy scanning electron microscope with atomic resolution

    International Nuclear Information System (INIS)

    Eastham, D. A.; Edmondson, P.; Greene, S.; Donnelly, S.; Olsson, E.; Svensson, K.; Bleloch, A.

    2009-01-01

    We describe a type of scanning electron microscope that works by directly imaging the electron field-emission sites on a nanotip. Electrons are extracted from the nanotip through a nanoscale aperture, accelerated in a high electric field, and focused to a spot using a microscale Einzel lens. If the whole microscope (accelerating section and lens) and the focal length are both restricted in size to below 10 μm, then computer simulations show that the effects of aberration are extremely small and it is possible to have a system with approximately unit magnification at electron energies as low as 300 eV. Thus a typical emission site of 1 nm diameter will produce an image of the same size, and an atomic emission site will give a resolution of 0.1-0.2 nm (1-2 A). Also, because the beam is not allowed to expand beyond 100 nm in diameter, the depth of field is large and the contribution to the beam spot size from chromatic aberrations is less than 0.02 nm (0.2 A) for 500 eV electrons. Since it is now entirely possible to make stable atomic sized emitters (nanopyramids), it is expected that this instrument will have atomic resolution. Furthermore the brightness of the beam is determined only by the field emission and can be up to 1x10 6 times larger than in a typical (high energy) electron microscope. The advantages of this low energy, bright-beam electron microscope with atomic resolution are described and include the possibility of it being used to rapidly sequence the human genome from a single strand of DNA as well as being able to identify atomic species directly from the elastic scattering of electrons

  2. Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope

    OpenAIRE

    Nazin, G. V.; Wu, S. W.; Ho, W.

    2005-01-01

    The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks correspondi...

  3. Electron microscopic identification of Zinga virus as a strain of Rift Valley fever virus.

    Science.gov (United States)

    Olaleye, O D; Baigent, C L; Mueller, G; Tomori, O; Schmitz, H

    1992-01-01

    Electron microscopic examination of a negatively stained suspension of Zinga virus showed particles 90-100 nm in diameter, enveloped with spikes 12-20 nm in length and 5 nm in diameter. Further identification of the virus by immune electron microscopy showed the reactivity of human Rift Valley fever virus-positive serum with Zinga virus. Results of this study are in agreement with earlier reports that Zinga virus is a strain of Rift Valley fever virus.

  4. Transmission electron microscope interfaced with ion accelerators and its application to materials science

    Energy Technology Data Exchange (ETDEWEB)

    Abe, Hiroaki; Naramoto, Hiroshi [Japan Atomic Energy Research Inst., Takasaki, Gunma (Japan). Takasaki Radiation Chemistry Research Establishment; Hojou, Kiichi; Furuno, Shigemi; Tsukamoto, Tetsuo

    1997-03-01

    We have developed the transmission/analytical electron microscope interfaced with two sets of ion accelerators (TEM-Accelerators Facility) at JAERI-Takasaki. The facility is expected to provide quantitative insights into radiation effects, such as damage evolution, irradiation-induced phase transformation and their stability, through in-situ observation and analysis under ion and/or electron irradiation. The TEM-Accelerators Facility and its application to materials research are reviewed. (author)

  5. Optical and mechanical design for 1 nm resolution Auger spectroscopy in an electron microscope

    International Nuclear Information System (INIS)

    Bleeker, A.J.

    1991-01-01

    Detailed information about the atomic structure of surfaces and interfaces is vital for the progress in materials science and physics. One widely used surface sensitive technique is Auger spectroscopy (AS). This technique, in which the electron energy spectrum emerging from the sample is evaluated, gives information about the average elemental composition of the surface over a relative large surface area (>30nm). Electron microscopy (EM), on the other hand, is capable of producing surface structural, but no elemental, information with almost atomic resolution. EM and AS techniques have not been combined so far because of the different nature of the instrumentation used in both techniques. In AS instruments the sample is placed in an Ultra High Vacuum (UHV) system with a relatively large open space around the sample. In EM the sample is situated in the tight volume between the magnetic polepieces of the probe forming objective lens. The space around the sample is therefore tight. Furthermore the vacuum in most electron microscopes is not in UHV range. Radical mechanical changes to improve the vacuum are necessary to do AS in an electron microscope. Since the sample is immersed in the strong magnetic field of the objective lens the Auger electrons can not be extracted with conventional electrostatical methods. The only possibility to extract the Auger electrons is through the upper bore of the objective lens. However, this has large implications on the optical system of the microscope and requires a thorough investigation of the extraction of the Auger electrons. In this work it will be discussed how the surface sensitive AS can be combined with the high spatial resolution of the electron microscope in a practical instrument. (author). 102 refs.; 81 figs.; 4 tabs

  6. Future directions in standing-wave photoemission

    Energy Technology Data Exchange (ETDEWEB)

    Gray, Alexander X., E-mail: axgray@temple.edu

    2014-08-15

    Highlights: • Probing magnetic properties at the buried interface with SW-MCD. • Probing electronic structure at the buried interface with resonant SW-XPS and SW-HAXPES. • Probing momentum-resolved electronic structure at a buried interface with SWARPES. • Adding depth resolution to photoemission microscopy with standing-wave excitation. • Standing-wave localization, total reflection and waveguide effects. - Abstract: Over the past decade, standing-wave photoemission (SW-XPS) has evolved into a powerful and versatile non-destructive technique for probing element-specific electronic, magnetic, and structural properties of buried layers and interfaces with sub-nanometer depth resolution. In this article, I will discuss several promising future directions in this emergent field stemming from experimental and theoretical studies wherein SW-XPS is combined with other X-ray techniques, such as magnetic circular dichroism (MCD), hard X-ray photoemission spectroscopy (HAXPES), angle-resolved photoemission (ARPES), and photoemission microscopy (PEEM), adding extra dimensions to the measurement and thus widening the scope of scientific and technological questions accessible via the use of standing waves. I will further discuss examples of recently developed methods for X-ray standing-wave data analysis, which yield layer-resolved matrix-element-weighted densities of states at interfaces as well as Ångstrom-level changes in periodicity of synthetic superlattices. Finally, I will explore the possibility of localizing the standing waves near the surface and within a buried layer by the use of aperiodic superlattices, total reflection, and X-ray waveguide effects.

  7. Future directions in standing-wave photoemission

    International Nuclear Information System (INIS)

    Gray, Alexander X.

    2014-01-01

    Highlights: • Probing magnetic properties at the buried interface with SW-MCD. • Probing electronic structure at the buried interface with resonant SW-XPS and SW-HAXPES. • Probing momentum-resolved electronic structure at a buried interface with SWARPES. • Adding depth resolution to photoemission microscopy with standing-wave excitation. • Standing-wave localization, total reflection and waveguide effects. - Abstract: Over the past decade, standing-wave photoemission (SW-XPS) has evolved into a powerful and versatile non-destructive technique for probing element-specific electronic, magnetic, and structural properties of buried layers and interfaces with sub-nanometer depth resolution. In this article, I will discuss several promising future directions in this emergent field stemming from experimental and theoretical studies wherein SW-XPS is combined with other X-ray techniques, such as magnetic circular dichroism (MCD), hard X-ray photoemission spectroscopy (HAXPES), angle-resolved photoemission (ARPES), and photoemission microscopy (PEEM), adding extra dimensions to the measurement and thus widening the scope of scientific and technological questions accessible via the use of standing waves. I will further discuss examples of recently developed methods for X-ray standing-wave data analysis, which yield layer-resolved matrix-element-weighted densities of states at interfaces as well as Ångstrom-level changes in periodicity of synthetic superlattices. Finally, I will explore the possibility of localizing the standing waves near the surface and within a buried layer by the use of aperiodic superlattices, total reflection, and X-ray waveguide effects

  8. Electronic Structure of C60/Zinc Phthalocyanine/V₂O₅ Interfaces Studied Using Photoemission Spectroscopy for Organic Photovoltaic Applications.

    Science.gov (United States)

    Lim, Chang Jin; Park, Min Gyu; Kim, Min Su; Han, Jeong Hwa; Cho, Soohaeng; Cho, Mann-Ho; Yi, Yeonjin; Lee, Hyunbok; Cho, Sang Wan

    2018-02-18

    The interfacial electronic structures of a bilayer of fullerene (C 60 ) and zinc phthalocyanine (ZnPc) grown on vanadium pentoxide (V₂O₅) thin films deposited using radio frequency sputtering under various conditions were studied using X-ray and ultraviolet photoelectron spectroscopy. The energy difference between the highest occupied molecular orbital (HOMO) level of the ZnPc layer and the lowest unoccupied molecular orbital (LUMO) level of the C 60 layer was determined and compared with that grown on an indium tin oxide (ITO) substrate. The energy difference of a heterojunction on all V₂O₅ was found to be 1.3~1.4 eV, while that on ITO was 1.1 eV. This difference could be due to the higher binding energy of the HOMO of ZnPc on V₂O₅ than that on ITO regardless of work functions of the substrates. We also determined the complete energy level diagrams of C 60 /ZnPc on V₂O₅ and ITO.

  9. Modeling a Miniaturized Scanning Electron Microscope Focusing Column - Lessons Learned in Electron Optics Simulation

    Science.gov (United States)

    Loyd, Jody; Gregory, Don; Gaskin, Jessica

    2016-01-01

    This presentation discusses work done to assess the design of a focusing column in a miniaturized Scanning Electron Microscope (SEM) developed at the NASA Marshall Space Flight Center (MSFC) for use in-situ on the Moon-in particular for mineralogical analysis. The MSFC beam column design uses purely electrostatic fields for focusing, because of the severe constraints on mass and electrical power consumption imposed by the goals of lunar exploration and of spaceflight in general. The resolution of an SEM ultimately depends on the size of the focused spot of the scanning beam probe, for which the stated goal here is a diameter of 10 nanometers. Optical aberrations are the main challenge to this performance goal, because they blur the ideal geometrical optical image of the electron source, effectively widening the ideal spot size of the beam probe. In the present work the optical aberrations of the mini SEM focusing column were assessed using direct tracing of non-paraxial rays, as opposed to mathematical estimates of aberrations based on paraxial ray-traces. The geometrical ray-tracing employed here is completely analogous to ray-tracing as conventionally understood in the realm of photon optics, with the major difference being that in electron optics the lens is simply a smoothly varying electric field in vacuum, formed by precisely machined electrodes. Ray-tracing in this context, therefore, relies upon a model of the electrostatic field inside the focusing column to provide the mathematical description of the "lens" being traced. This work relied fundamentally on the boundary element method (BEM) for this electric field model. In carrying out this research the authors discovered that higher accuracy in the field model was essential if aberrations were to be reliably assessed using direct ray-tracing. This led to some work in testing alternative techniques for modeling the electrostatic field. Ultimately, the necessary accuracy was attained using a BEM

  10. Towards native-state imaging in biological context in the electron microscope

    Science.gov (United States)

    Weston, Anne E.; Armer, Hannah E. J.

    2009-01-01

    Modern cell biology is reliant on light and fluorescence microscopy for analysis of cells, tissues and protein localisation. However, these powerful techniques are ultimately limited in resolution by the wavelength of light. Electron microscopes offer much greater resolution due to the shorter effective wavelength of electrons, allowing direct imaging of sub-cellular architecture. The harsh environment of the electron microscope chamber and the properties of the electron beam have led to complex chemical and mechanical preparation techniques, which distance biological samples from their native state and complicate data interpretation. Here we describe recent advances in sample preparation and instrumentation, which push the boundaries of high-resolution imaging. Cryopreparation, cryoelectron microscopy and environmental scanning electron microscopy strive to image samples in near native state. Advances in correlative microscopy and markers enable high-resolution localisation of proteins. Innovation in microscope design has pushed the boundaries of resolution to atomic scale, whilst automatic acquisition of high-resolution electron microscopy data through large volumes is finally able to place ultrastructure in biological context. PMID:19916039

  11. Light and scanning electron microscopic examination of hair in Garlic's syndrome

    International Nuclear Information System (INIS)

    Celik, Hakan H.; Tunali, S.; Tatar, I.; Aldur, Muhammad M.; Tore, H.

    2007-01-01

    Grisceli syndrome is a rare disease is a rare disease characterized by pigment dilution, partial albinism, variable cellular immunodeficiency and an acute phase of uncontrolled T-lymphocyte macrophage activation. Griscelli et al described this syndrome in 1978. Since then, only approximately, 60 cases have been reported, most from Turkish and Mediterranean population. In microscopic examination, silvery grey hair with large clumped melanosomes on the hair shaft is the diagnostic finding. Here, we present scanning electron microscopic study of hair in 2 cases of Griscelli syndrome where the hair showed normal cuticular pattern but nodular structures were present as an abnormal finding. (author)

  12. Electron microscope studies. Progress report, 1 July 1964--1 June 1992

    Energy Technology Data Exchange (ETDEWEB)

    Crewe, A.V.; Kapp, O.H.

    1992-07-01

    This is a report covering the research performed in the Crewe laboratory between 1964 and 1992. Because of limitations of space we have provided relatively brief summaries of the major research directions of the facility during these years. A complete bibliography has been included and we have referenced groups of pertinent publications at the beginning of each section. This report summarizes our efforts to develop better electron microscopes and chronicles many of the experimental programs, in materials science and biology, that acted both as a stimulus to better microscope design and also as a testing ground for many instrumental innovations.

  13. Pleomorphic (giant cell) carcinoma of the intestine. An immunohistochemical and electron microscopic study

    DEFF Research Database (Denmark)

    Bak, Martin; Teglbjaerg, P S

    1989-01-01

    reaction for neuron-specific enolase (NSE) was found in three tumors and a positive reaction for chromogranin was found in one tumor. On electron microscopic study, intracytoplasmic whorls of intermediate filaments were seen in the perinuclear area. Dense core "neurosecretory" granules were rarely seen......Pleomorphic (giant cell) carcinomas have been described in the lungs, thyroid, pancreas, and gallbladder. Two pleomorphic carcinomas of the small bowel and two of the large bowel are presented. On light microscopic study, the carcinomas were solid, without squamous or glandular differentiation...

  14. Ultrastructural alterations in ciliary cells exposed to ionizing radiation. A scanning and transmission electron microscopic study

    Energy Technology Data Exchange (ETDEWEB)

    Baldetorp, L; Mecklenburg, C v; Haakansson, C H [Lund Univ. (Sweden). Hospital; Lund Univ. (Sweden). Dept. of Zoology)

    1977-01-01

    Early effects of ionizing radiation were investigated in an experimental in vitro system using the ciliary cells of the tracheal mucous membrane of the rabbit, irradiated at 30/sup 0/C and at more than 90% humidity. The changes in physiological activities of the ciliary cells caused by irradation were continously registered during the irradation. The specimens were examined immediately after irradiation electron microscopically. The morphological changes in irradiated material after 10-70 Gy are compared with normal material. After 40-70 Gy, scanning electron microscopy revealed the formation of vesicles on cilia, and club-like protrusions and adhesion of their tips. After 30-70 Gy, a swelling of mitochondrial membranes and cristae was apparent transmission electron microscopically. The membrane alterations caused by irradiation are assumed to disturb the permeability and flow of ATP from the mitochondria, which in turn leads to the recorded changes in the activity of the ciliated cells.

  15. Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope.

    Science.gov (United States)

    Nazin, G V; Wu, S W; Ho, W

    2005-06-21

    The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks corresponding to the individual vibronic states depends on the relative electron tunneling rates through the two barriers of the junction, as found by varying the vacuum gap tunneling rate by changing the height of the scanning tunneling microscope tip above the molecule. A simple, sequential tunneling model explains the observed trends.

  16. The improved stability of an organic crystal in the Hitachi HV-1 high vacuum electron microscope

    International Nuclear Information System (INIS)

    Hartman, R.S.; Hartman, R.E.; Alsberg, H.; Nathan, R.

    1974-01-01

    A specimen of crystalline indanthrene olive T was placed in the HV-1, which was then pumped for 2 hours. The 25 A bright field fringe pattern was then observed on the TV monitor. Deterioration was noted very shortly, and the electron microscope was then pumped for three days, after which another field was subjected to the same level of irradiation by 50 KV electrons. It was found that there was little if any deterioration even after 20 minutes. It was concluded that it is possible to find conditions in a transmission EM where stability far exceeds that predicted by current theories of radiation damage or demonstrated by conventional electron microscopes. (R.L.)

  17. Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Alloyeau, D., E-mail: alloyeau.damien@gmail.com [National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS/72, Berkeley, CA 94720 (United States); Hsieh, W.K. [National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS/72, Berkeley, CA 94720 (United States); Anderson, E.H.; Hilken, L. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley CA 94720 (United States); Benner, G. [Carl Zeiss NTS GmbH, Oberkochen 73447 (Germany); Meng, X. [Electrical Engineering and Computer Sciences, UC Berkeley, Berkeley, CA 94720-1770 (United States); Chen, F.R. [Department of Engineering and System Science, National Tsing Hua University, Hsinchu, Taiwan (China); Kisielowski, C. [National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, MS/72, Berkeley, CA 94720 (United States)

    2010-04-15

    Using two levels of electron beam lithography, vapor phase deposition techniques, and FIB etching, we have fabricated an electrostatic Boersch phase plate for contrast enhancement of weak phase objects in a transmission electron microscope. The phase plate has suitable dimensions for the imaging of small biological samples without compromising the high-resolution capabilities of the microscope. A micro-structured electrode allows for phase tuning of the unscattered electron beam, which enables the recording of contrast enhanced in-focus images and in-line holograms. We have demonstrated experimentally that our phase plate improves the contrast of carbon nanotubes while maintaining high-resolution imaging performance, which is demonstrated for the case of an AlGaAs heterostructure. The development opens a new way to study interfaces between soft and hard materials.

  18. Photoemission of Single Dust Grains for Heliospheric Conditions

    Science.gov (United States)

    Spann, James F., Jr.; Venturini, Catherine C.; Abbas, Mian M.; Comfort, Richard H.

    2000-01-01

    Initial results of an experiment to measure the photoemission of single dust grains as a function of far ultraviolet wavelengths are presented. Coulombic forces dominate the interaction of the dust grains in the heliosphere. Knowledge of the charge state of dust grains, whether in a dusty plasma (Debye length grains is primarily determined by primary electron and ion collisions, secondary electron emission and photoemission due to ultraviolet sunlight. We have established a unique experimental technique to measure the photoemission of individual micron-sized dust grains in vacuum. This technique resolves difficulties associated with statistical measurements of dust grain ensembles and non-static dust beams. The photoemission yield of Aluminum Oxide 3-micron grains For wavelengths from 120-300 nm with a spectral resolution of 1 nm FWHM is reported. Results are compared to interplanetary conditions.

  19. Progress in element analysis on a high-voltage electron microscope

    International Nuclear Information System (INIS)

    Tivol, W.F.; Barnard, D.; Guha, T.

    1985-01-01

    X-Ray microprobe (XMA) and electron energy-loss (EELS) spectrometers have been installed on the high-voltage electron microscope (HVEM). The probe size has been measured and background reduction is in progress for XMA and EELS as are improvements in electron optics for EELS and sensitivity measurements. XMA is currently useful for qualitative analysis and has been used by several investigators from our laboratory and outside laboratories. However, EELS background levels are still too high for meaningful results to be obtained. Standards suitable for biological specimens are being measured, and a library for quantitative analysis is being compiled

  20. A novel low energy electron microscope for DNA sequencing and surface analysis

    Energy Technology Data Exchange (ETDEWEB)

    Mankos, M., E-mail: marian@electronoptica.com [Electron Optica Inc., 1000 Elwell Court #110, Palo Alto, CA 94303 (United States); Shadman, K. [Electron Optica Inc., 1000 Elwell Court #110, Palo Alto, CA 94303 (United States); Persson, H.H.J. [Stanford Genome Technology Center, Stanford University School of Medicine, 855 California Avenue, Palo Alto, CA 94304 (United States); N’Diaye, A.T. [Electron Optica Inc., 1000 Elwell Court #110, Palo Alto, CA 94303 (United States); NCEM, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Schmid, A.K. [NCEM, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States); Davis, R.W. [Stanford Genome Technology Center, Stanford University School of Medicine, 855 California Avenue, Palo Alto, CA 94304 (United States)

    2014-10-15

    individual DNA bases in a sequence. - Highlights: • We present a LEEM with a monochromator, aberration corrector, energy filter and two electron beams. • We analyze objective lens aberrations up to 5th order with and without aberration correction. • A pentode mirror corrector combined with a monochromator greatly reduces blur. • We present experimental data from bulk DNA specimens demonstrating that base specific contrast is available with X-ray photoemission, Auger, and reflected electrons. • Contrast simulations utilizing the minimum experimental contrast predict that images will yield a relatively low error rate are obtainable.

  1. Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

    Science.gov (United States)

    de Jonge, Niels [Oak Ridge, TN

    2010-08-17

    A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

  2. Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope.

    Science.gov (United States)

    Johnston-Peck, Aaron C; DuChene, Joseph S; Roberts, Alan D; Wei, Wei David; Herzing, Andrew A

    2016-11-01

    Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO 2 indicate that there is not a critical dose required for the accumulation of electron beam damage. Instead, measurements using annular dark field scanning transmission electron microscopy and electron energy loss spectroscopy demonstrate that the onset of measurable damage occurs when a critical dose rate is exceeded. The mechanism behind this phenomenon is that oxygen vacancies created by exposure to a 300keV electron beam are actively annihilated as the sample re-oxidizes in the microscope environment. As a result, only when the rate of vacancy creation exceeds the recovery rate will beam damage begin to accumulate. This observation suggests that dose-intensive experiments can be accomplished without disrupting the native structure of the sample when executed using dose rates below the appropriate threshold. Furthermore, the presence of an encapsulating carbonaceous layer inhibits processes that cause beam damage, markedly increasing the dose rate threshold for the accumulation of damage. Published by Elsevier B.V.

  3. Characterization of Li-rich layered oxides by using transmission electron microscope

    Directory of Open Access Journals (Sweden)

    Hu Zhao

    2017-07-01

    Full Text Available Lithium-rich layered oxides (LrLOs deliver extremely high specific capacities and are considered to be promising candidates for electric vehicle and smart grid applications. However, the application of LrLOs needs further understanding of the structural complexity and dynamic evolution of monoclinic and rhombohedral phases, in order to overcome the issues including voltage decay, poor rate capability, initial irreversible capacity loss and etc. The development of aberration correction for the transmission electron microscope and concurrent progress in electron spectroscopy, have fueled rapid progress in the understanding of the mechanism of such issues. New techniques based on the transmission electron microscope are first surveyed, and the applications of these techniques for the study of the structure, migration of transition metal, and the activation of oxygen of LrLOs are then explored in detail, with a particular focus on the mechanism of voltage decay. Keywords: Lithium-ion battery, Transmission electron microscope, Lithium-rich layered oxide, Cathode material

  4. Quantum coherent optical phase modulation in an ultrafast transmission electron microscope.

    Science.gov (United States)

    Feist, Armin; Echternkamp, Katharina E; Schauss, Jakob; Yalunin, Sergey V; Schäfer, Sascha; Ropers, Claus

    2015-05-14

    Coherent manipulation of quantum systems with light is expected to be a cornerstone of future information and communication technology, including quantum computation and cryptography. The transfer of an optical phase onto a quantum wavefunction is a defining aspect of coherent interactions and forms the basis of quantum state preparation, synchronization and metrology. Light-phase-modulated electron states near atoms and molecules are essential for the techniques of attosecond science, including the generation of extreme-ultraviolet pulses and orbital tomography. In contrast, the quantum-coherent phase-modulation of energetic free-electron beams has not been demonstrated, although it promises direct access to ultrafast imaging and spectroscopy with tailored electron pulses on the attosecond scale. Here we demonstrate the coherent quantum state manipulation of free-electron populations in an electron microscope beam. We employ the interaction of ultrashort electron pulses with optical near-fields to induce Rabi oscillations in the populations of electron momentum states, observed as a function of the optical driving field. Excellent agreement with the scaling of an equal-Rabi multilevel quantum ladder is obtained, representing the observation of a light-driven 'quantum walk' coherently reshaping electron density in momentum space. We note that, after the interaction, the optically generated superposition of momentum states evolves into a train of attosecond electron pulses. Our results reveal the potential of quantum control for the precision structuring of electron densities, with possible applications ranging from ultrafast electron spectroscopy and microscopy to accelerator science and free-electron lasers.

  5. Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.

    Science.gov (United States)

    Yoon, Yeo Hun; Kim, Seung Jae; Kim, Dong Hwan

    2015-12-01

    The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film. © The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  6. Electronic properties of Nd{sub 2−x}Ce{sub x}CuO{sub 4+δ}: A hard X-ray photoemission investigation

    Energy Technology Data Exchange (ETDEWEB)

    Guarino, A., E-mail: guarino@sa.infn.it [CNR-SPIN-Salerno, Fisciano, SA (Italy); Dipartimento di Fisica “E. R. Caianiello” Università di Salerno, Fisciano, SA (Italy); Panaccione, G. [CNR-IOM Laboratorio TASC, AREA Science Park, 34012 Basovizza, TS (Italy); Offi, F. [CNISM and Dipartimento di Scienze, Università Roma Tre, Roma (Italy); Monaco, G. [Dipartimento di Fisica, Università di Trento, Trento (Italy); Fondacaro, A. [European Synchrotron Radiation Facility, BP 220, F-38042 Grenoble (France); Torelli, P. [CNR-IOM Laboratorio TASC, AREA Science Park, 34012 Basovizza, TS (Italy); Fittipaldi, R.; Vecchione, A. [CNR-SPIN-Salerno, Fisciano, SA (Italy); Pace, S.; Nigro, A. [CNR-SPIN-Salerno, Fisciano, SA (Italy); Dipartimento di Fisica “E. R. Caianiello” Università di Salerno, Fisciano, SA (Italy)

    2016-10-15

    Highlights: • We grow and characterize Nd{sub 2−x}Ce{sub x}CuO{sub 4+δ} samples as thin film and single crystal. • We study the Cu 2p levels of our samples by hard X-ray photoemission spectroscopy. • We investigate bulk features of the Nd{sub 2−x}Ce{sub x}CuO{sub 4+δ} samples. • Signature of the bulk response is correlated with the crystallinity of the samples. - Abstract: Cu 2p core levels spectra measured by X-ray photoemission spectroscopy of selected as-grown Nd{sub 2−x}Ce{sub x}CuO{sub 4+δ} samples are presented and discussed. The presence of a satellite peak in the 2p core level of Nd{sub 2−x}Ce{sub x}CuO{sub 4+δ} single crystal by hard X-ray photoemission is confirmed in all non-superconducting samples, films and single crystals investigated in this work. The comparison of the spectral features of the different samples suggests that the presence and the intensity of this satellite peak is not related to the electric transport properties, but to the texture characteristics.

  7. Scanning photoemission microscopy with synchrotron radiation

    Science.gov (United States)

    Ade, Harald W.

    1992-08-01

    Progress in photoemission spectro-microscopy at various synchrotron radiation facilities is reviewed. Microprobe devices such as MAXIMUM at the SRC in Wisconsin, the X1-SPEM at the NSLS at BNL, as well as the ellipsoidal ring mirror microscope at DESY in Hamburg, recorded first images during the last few years. The present status of these devices which achieve their lateral resolution by focusing X-rays to a small spot is the primary focus of this paper, but work representing other approaches to spectro-microscopy is also discussed.

  8. Soft X-ray imaging with axisymmetry microscope and electronic readout

    International Nuclear Information System (INIS)

    Sauneuf, A.; Cavailler, C.; Henry, Ph.; Launspach, J.; Mascureau, J. de; Rostaing, M.

    1984-11-01

    An axisymmetric microscope with 10 X magnification has been constructed; its resolution has been measured using severals grids, backlighted by an X-ray source and found to be near 25 μm. So it could be used to make images of laser driven plasmas in the soft X-ray region. In order to see rapidly those images we have associated it with a new detector. It is a small image converter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a CCD working in the spectral range. An electronic image readout chain, which is identical to those we use with streak cameras, then processes automatically and immediatly the images given by the microscope

  9. Identification of dorsal root synaptic terminals on monkey ventral horn cells by electron microscopic autoradiography

    International Nuclear Information System (INIS)

    Ralston, H.J.; Ralston, D.D.

    1979-01-01

    The projection of dorsal root fibres to the motor nucleus of the macaque monkey spinal cord has been examined utilizing light and electron microscopic autoradiography. Light microscopy demonstrates a very sparse labelling of primary afferent fibres in the ventral horn. Silver grains overlying radioactive sources are frequently clustered into small groups, often adjacent to dendritic profiles. Under the electron microscope, myelinated axons and a few large synaptic profiles containing rounded synaptic vesicles were overlain by numerous silver grains. These labelled profiles made synaptic contact with dendrites 1 - 3 micrometers in diameter. The labelled profiles did not contact cell bodies or large proximal dendrites of ventral horn neutrons. Frequently, small synaptic profiles containing flattened vesicles were presynaptic to the large labelled terminals and it is suggested that these axoaxonal synapses may mediate presynaptic inhibition of the primary afferent fibres. The relationship of the present findings to previously published physiological and anatomical studies is discussed. (author)

  10. Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process

    Science.gov (United States)

    Cui, Le; Marchand, Éric

    2015-04-01

    A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article. A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014. . Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.

  11. Accumulation of enriched uranium UO2F2 in ultrastructure as studied by electron microscopic autoradiography

    International Nuclear Information System (INIS)

    Zhu Shoupeng; Wang Yuanchang

    1992-01-01

    A study was made on the retention of soluble enriched uranium UO 2 F 2 in ultrastructure by electron microscopic autoradiography. The early dynamic accumulation of radioactivity in the body showed that enriched uranium UO 2 F 2 was mainly localized in kidneys, especially accumulated in epithelial cells of proximal convoluted tubules leading to degeneration and necrosis of the tubules. In liver cells, enriched uranium UO 2 F 2 at first deposited in nuclei of the cells and in soluble proteins of the plasma, and later accumulated selectively in mitochondria and lysosomes. On electron microscopic autoradiographic study it was shown that the dynamic retention of radioactivity of enriched uranium UO 2 F 2 in skeleton increased steadily through the time period of exposure. Enriched uranium UO 2 F 2 chiefly deposited in nuclei and mitochondria of osteoblasts as well as of osteoclasts

  12. Scanning electron microscope cathodoluminescence imaging of subgrain boundaries, twins and planar deformation features in quartz

    Science.gov (United States)

    Hamers, M. F.; Pennock, G. M.; Drury, M. R.

    2017-04-01

    The study of deformation features has been of great importance to determine deformation mechanisms in quartz. Relevant microstructures in both growth and deformation processes include dislocations, subgrains, subgrain boundaries, Brazil and Dauphiné twins and planar deformation features (PDFs). Dislocations and twin boundaries are most commonly imaged using a transmission electron microscope (TEM), because these cannot directly be observed using light microscopy, in contrast to PDFs. Here, we show that red-filtered cathodoluminescence imaging in a scanning electron microscope (SEM) is a useful method to visualise subgrain boundaries, Brazil and Dauphiné twin boundaries. Because standard petrographic thin sections can be studied in the SEM, the observed structures can be directly and easily correlated to light microscopy studies. In contrast to TEM preparation methods, SEM techniques are non-destructive to the area of interest on a petrographic thin section.

  13. Development and application of a window-type environmental cell in high voltage electron microscope

    International Nuclear Information System (INIS)

    Wakasugi, Takenobu; Isobe, Shigehito; Umeda, Ayaka; Wang, Yongming; Hashimoto, Naoyuki; Ohnuki, Somei

    2013-01-01

    Highlights: ► A window-type environmental cell for a high voltage electron microscope (HVEM) is developed. ► In situ HVEM image of Pd under an H2 gas pressure is obtained. ► The effect of the window materials on the resolution and contamination of the HVEM image is tested. -- Abstract: A close type of an environmental cell was developed for a high voltage electron microscope. Using this cell allowed an in situ observation of hydrogenation in Pd particles under H 2 gas of 0.05 MPa at RT. Two types of window films, Tri-Acetyl-Cellulose (TAC) and Silicon Nitride (SiN), were used for testing the contamination on the sample, as well as the strength for pressure. We confirmed the hydrogenation in diffraction patterns and images, and additionally the image resolution of 0.19 nm was obtained by using a SiN film with a thickness of 17 nm

  14. Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

    International Nuclear Information System (INIS)

    Behan, G; Nellist, P D

    2008-01-01

    The use of spherical aberration correctors in the scanning transmission electron microscope (STEM) has the effect of reducing the depth of field of the microscope, making three-dimensional imaging of a specimen possible by optical sectioning. Depth resolution can be improved further by placing aberration correctors and lenses pre and post specimen to achieve an imaging mode known as scanning confocal electron microscopy (SCEM). We present the calculated incoherent point spread functions (PSF) and optical transfer functions (OTF) of a STEM and SCEM. The OTF for a STEM is shown to have a missing cone region which results in severe blurring along the optic axis, which can be especially severe for extended objects. We also present strategies for reconstruction of experimental data, such as three-dimensional deconvolution of the point spread function.

  15. Revealing the 1 nm/s Extensibility of Nanoscale Amorphous Carbon in a Scanning Electron Microscope

    DEFF Research Database (Denmark)

    Zhang, Wei

    2013-01-01

    In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformation...... promoted by the electric field, which resulted from an inner secondary electron potential difference from the main trunk of carbon film to the tip end of branches under electron beam. This result demonstrates importance of applying electrical effects to modify properties of carbon materials. It may have...... positive implications to explore some amorphous carbon as electron field emission device. SCANNING 35: 261-264, 2013. © 2012 Wiley Periodicals, Inc....

  16. Enhanced thermal stability of a polymer solar cell blend induced by electron beam irradiation in the transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Bäcke, Olof, E-mail: obacke@chalmers.se [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden); Lindqvist, Camilla; Diaz de Zerio Mendaza, Amaia [Department of Chemistry and Chemical Engineering, Chalmers University of Technology, 41296 Göteborg (Sweden); Gustafsson, Stefan [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden); Wang, Ergang; Andersson, Mats R.; Müller, Christian [Department of Chemistry and Chemical Engineering, Chalmers University of Technology, 41296 Göteborg (Sweden); Kristiansen, Per Magnus [Institute of Polymer Nanotechnology (INKA), FHNW University of Applied Science and Arts Northwestern Switzerland, 5210 Windisch (Switzerland); Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, 5232 Villigen (Switzerland); Olsson, Eva, E-mail: eva.olsson@chalmers.se [Department of Applied Physics, Chalmers University of Technology, 41296 Göteborg (Sweden)

    2017-05-15

    We show by in situ microscopy that the effects of electron beam irradiation during transmission electron microscopy can be used to lock microstructural features and enhance the structural thermal stability of a nanostructured polymer:fullerene blend. Polymer:fullerene bulk-heterojunction thin films show great promise for use as active layers in organic solar cells but their low thermal stability is a hindrance. Lack of thermal stability complicates manufacturing and influences the lifetime of devices. To investigate how electron irradiation affects the thermal stability of polymer:fullerene films, a model bulk-heterojunction film based on a thiophene-quinoxaline copolymer and a fullerene derivative was heat-treated in-situ in a transmission electron microscope. In areas of the film that exposed to the electron beam the nanostructure of the film remained stable, while the nanostructure in areas not exposed to the electron beam underwent large phase separation and nucleation of fullerene crystals. UV–vis spectroscopy shows that the polymer:fullerene films are stable for electron doses up to 2000 kGy. - Highlights: • Thermal stability of a polymer: fullerne blend is increased using electron irradiation. • Using in-situ transmission electron microscopy the nanostructure is studied. • Electron irradiation stops phase separation between the polymer and fullerene. • Electron irradiation quenches the formation and nucleation of fullerene crystals.

  17. Electronic zooming TV readout system for an x-ray microscope

    International Nuclear Information System (INIS)

    Kinoshita, K.; Matsumura, T.; Inagaki, Y.; Hirai, N.; Sugiyama, M.; Kihara, H.; Watanabe, N.; Shimanuki, Y.

    1993-01-01

    The electronic zooming TV readout system using the X-ray zooming tube has been developed for purposes of real-time readout of very high resolution X-ray image, e.g. the output image from an X-ray microscope. The system limiting resolution is 0.2∼0.3 μm and it is easy to operate in practical applications

  18. Solving Research Tasks Using Desk top Scanning Electron Microscope Phenom ProX

    Directory of Open Access Journals (Sweden)

    Vertsanova, O.V.

    2014-03-01

    Full Text Available Phenom ProX — morden effective universal desktop Scanning Electron Microscope with integrated EDS system. Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

  19. Examination of mycological samples by means of the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M. Thibaut

    1973-04-01

    Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.

  20. A Transmission Electron Microscope Investigation of Space Weathering Effects in Hayabusa Samples

    Science.gov (United States)

    Keller, Lindsay P.; Berger, Eve L.

    2014-01-01

    The Hayabusa mission to asteroid 25143 Itokawa successfully returned the first direct samples of the regolith from the surface of an asteroid. The Hayabusa samples thus present a special opportunity to directly investigate the evolution of asteroidal surfaces, from the development of the regolith to the study of the more complex effects of space weathering. Here we describe the mineralogy, microstructure and composition of three Hayabusa mission particles using transmission electron microscope (TEM) techniques

  1. Elementary and advanced Lie algebraic methods with applications to accelerator design, electron microscopes, and light optics

    International Nuclear Information System (INIS)

    Dragt, A.J.

    1987-01-01

    A review is given of elementary Lie algebraic methods for treating Hamiltonian systems. This review is followed by a brief exposition of advanced Lie algebraic methods including resonance bases and conjugacy theorems. Finally, applications are made to the design of third-order achromats for use in accelerators, to the design of subangstroem resolution electron microscopes, and to the classification and study of high order aberrations in light optics. (orig.)

  2. Electronic structure and microscopic model of CoNb2O6

    Science.gov (United States)

    Molla, Kaimujjaman; Rahaman, Badiur

    2018-05-01

    We present the first principle density functional calculations to figure out the underlying spin model of CoNb2O6. The first principles calculations define the main paths of superexchange interaction between Co spins in this compound. We discuss the nature of the exchange paths and provide quantitative estimates of magnetic exchange couplings. A microscopic modeling based on analysis of the electronic structure of this system puts it in the interesting class of weakly couple geometrically frustrated isosceles triangular Ising antiferromagnet.

  3. Congenital adenoma of the iris and ciliary body: light and electron microscopic observations.

    OpenAIRE

    Rennie, I G; Parsons, M A; Palmer, C A

    1992-01-01

    A 23-year-old man had a lesion in the right inferior iris which appeared to have enlarged since it was first seen when the patient was aged 5 years. The lesion was excised by a partial iridocyclectomy. Histopathologically the neoplasm was composed of both pigmented and non-pigmented cells. Pseudoacini, containing acid mucopolysaccharides, were present throughout the tumour matrix. Electron microscopically the non-pigmented cells were found to possess a convoluted plasmalemma, abundant rough e...

  4. Nanoscale Phase Separation and Lattice Complexity in VO2: The Metal–Insulator Transition Investigated by XANES via Auger Electron Yield at the Vanadium L23-Edge and Resonant Photoemission

    Directory of Open Access Journals (Sweden)

    Augusto Marcelli

    2017-12-01

    Full Text Available Among transition metal oxides, VO2 is a particularly interesting and challenging correlated electron material where an insulator to metal transition (MIT occurs near room temperature. Here we investigate a 16 nm thick strained vanadium dioxide film, trying to clarify the dynamic behavior of the insulator/metal transition. We measured (resonant photoemission below and above the MIT transition temperature, focusing on heating and cooling effects at the vanadium L23-edge using X-ray Absorption Near-Edge Structure (XANES. The vanadium L23-edges probe the transitions from the 2p core level to final unoccupied states with 3d orbital symmetry above the Fermi level. The dynamics of the 3d unoccupied states both at the L3- and at the L2-edge are in agreement with the hysteretic behavior of this thin film. In the first stage of the cooling, the 3d unoccupied states do not change while the transition in the insulating phase appears below 60 °C. Finally, Resonant Photoemission Spectra (ResPES point out a shift of the Fermi level of ~0.75 eV, which can be correlated to the dynamics of the 3d// orbitals, the electron–electron correlation, and the stability of the metallic state.

  5. Electron microscopic evaluation of a gold glaucoma micro shunt after explantation.

    Science.gov (United States)

    Berk, Thomas A; Tam, Diamond Y; Werner, Liliana; Mamalis, Nick; Ahmed, Iqbal Ike K

    2015-03-01

    We present a case of an explanted gold glaucoma micro shunt (GMS Plus) and the subsequent light and electron microscopic analyses. The shunt was implanted in a patient with medically refractive glaucoma. The intraocular pressure (IOP) was stable at 12 mm Hg 6 months postoperatively but spiked to 26 mm Hg 6 months later; membranous growth was visible on the implant gonioscopically. A second gold micro shunt was placed 2 years after the first. The IOP was 7 mm Hg 1 week postoperatively but increased to 23 mm Hg 3 weeks later; similar membranous growth was visible on this implant. One of the shunts was explanted, and light and scanning electron microscopic analyses revealed encapsulation around the shunt exterior and connective tissue invasion of the microstructure. This represents the first electron microscopic analysis of an explanted gold glaucoma micro shunt and the first unequivocal images of the fibrotic pseudo-capsule traversing its microchannels and fenestrations. Dr. Ahmed is a consultant to and has received research grants from Solx, Inc. No other author has a financial or proprietary interest in any material or method mentioned. Copyright © 2015 ASCRS and ESCRS. Published by Elsevier Inc. All rights reserved.

  6. In situ hybridization at the electron microscope level: hybrid detection by autoradiography and colloidal gold.

    Science.gov (United States)

    Hutchison, N J; Langer-Safer, P R; Ward, D C; Hamkalo, B A

    1982-11-01

    In situ hybridization has become a standard method for localizing DNA or RNA sequences in cytological preparations. We developed two methods to extend this technique to the transmission electron microscope level using mouse satellite DNA hybridization to whole mount metaphase chromosomes as the test system. The first method devised is a direct extension of standard light microscope level using mouse satellite DNA hybridization to whole mount metaphase chromosomes as the test system. The first method devised is a direct extension of standard light microscope in situ hybridization. Radioactively labeled complementary RNA (cRNA) is hybridized to metaphase chromosomes deposited on electron microscope grids and fixed in 70 percent ethanol vapor; hybridixation site are detected by autoradiography. Specific and intense labeling of chromosomal centromeric regions is observed even after relatively short exposure times. Inerphase nuclei present in some of the metaphase chromosome preparations also show defined paatterms of satellite DNA labeling which suggests that satellite-containing regions are associate with each other during interphase. The sensitivity of this method is estimated to at least as good as that at the light microscope level while the resolution is improved at least threefold. The second method, which circumvents the use of autoradiogrphic detection, uses biotin-labeled polynucleotide probes. After hybridization of these probes, either DNA or RNA, to fixed chromosomes on grids, hybrids are detected via reaction is improved at least threefold. The second method, which circumvents the use of autoradiographic detection, uses biotin-labeled polynucleotide probes. After hybridization of these probes, either DNA or RNA, to fixed chromosomes on grids, hybrids are detected via reaction with an antibody against biotin and secondary antibody adsorbed to the surface of over centromeric heterochromatin and along the associated peripheral fibers. Labeling is on average

  7. X-ray analysis of a single aerosol particle with combination of scanning electron microscope and synchrotron radiation X-ray microscope

    International Nuclear Information System (INIS)

    Toyoda, Masatoshi; Kaibuchi, Kazuki; Nagasono, Mitsuru; Terada, Yasuko; Tanabe, Teruo; Hayakawa, Shinjiro; Kawai, Jun

    2004-01-01

    We developed a microscope by a combination of synchrotron radiation X-ray fluorescence (SR-XRF) microscope and scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDX). SR-XRF is appropriate to detect trace and micro amount of elements and sensitive to heavy elements in an analyte but it cannot observe the real time image. SEM-EDX can observe the secondary electron image of a single particle in real time and is appropriate to detect lighter elements. This combination microscope can ensure the identification of the XRF spectrum to the SEM image without transferring the sample. For aerosol analysis, it is important to analyze each particle. The present method makes feasible to analyze not only the average elemental composition as the total particles but also elemental composition of each particle, which is dependent on the particle shape and size. The microscope was applied to an individual aerosol particle study. The X-ray spectra were different among the particles, but also different between SR-XRF and SEM-EDX for the same particle, due to the difference in fluorescence yields between X-ray excitation and electron excitation

  8. Light propagation and interaction observed with electrons

    Energy Technology Data Exchange (ETDEWEB)

    Word, Robert C.; Fitzgerald, J.P.S.; Könenkamp, R., E-mail: rkoe@pdx.edu

    2016-01-15

    We discuss possibilities for a microscopic optical characterization of thin films and surfaces based on photoemission electron microscopy. We show that propagating light with wavelengths across the visible range can readily be visualized, and linear and non-linear materials properties can be evaluated non-invasively with nanometer spatial resolution. While femtosecond temporal resolution can be achieved in pump-probe-type experiments, the interferometric approach presented here has typical image frame times of ~200 fs. - Highlights: • Non-linear photoemission electron micrographs are analyzed. • Optical properties of transparent and metallic thin films are determined. • Light propagation, surface plasmon resonances and energy transfer are discussed.

  9. SEM analysis of ionizing radiation effects in linear integrated circuits. [Scanning Electron Microscope

    Science.gov (United States)

    Stanley, A. G.; Gauthier, M. K.

    1977-01-01

    A successful diagnostic technique was developed using a scanning electron microscope (SEM) as a precision tool to determine ionization effects in integrated circuits. Previous SEM methods radiated the entire semiconductor chip or major areas. The large area exposure methods do not reveal the exact components which are sensitive to radiation. To locate these sensitive components a new method was developed, which consisted in successively irradiating selected components on the device chip with equal doses of electrons /10 to the 6th rad (Si)/, while the whole device was subjected to representative bias conditions. A suitable device parameter was measured in situ after each successive irradiation with the beam off.

  10. The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

    International Nuclear Information System (INIS)

    Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

    2011-01-01

    Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

  11. The Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Chapman, J.N.; Waddell, E.M.; Batson, P.E.; Ferrier, R.P.

    1979-01-01

    The most widely used method of investigating ferromagnetic films in the transmission electron microscope is the Fresnel or defocus mode of Lorentz microscopy. This may be implemented either in a fixed beam or a scanning instrument. Despite a rather inefficient utilization of electrons, several advantages accrue if the latter is used, and provided it is equipped with a field emission gun, low noise images may be obtained in acceptable recording times. To extract quantitative estimates of domain wall widths from such images it is necessary to measure accurately both instrumental and specimen parameters. Methods for this are discussed and an example of an analysis using a polycrystalline permalloy film is given. (Auth.)

  12. Transmission electron-microscopic studies of structural changes in polycrystalline graphite after high temperature irradiation

    International Nuclear Information System (INIS)

    Platonov, P.A.; Gurovich, B.A.; Shtrombakh, Ya.I.; Karpukhin, V.I.

    1985-01-01

    Transmission electron-microscopic investigation of polycrystalline graphite before and after irradiation is carried out. The direct use of graphite samples after ion thinning, as an inquiry subject is the basic peculiarity of the work. Main structural components of MPG-6 graphite before and after irradiation are revealed, the structural mechanism of the reactor graphite destruction under irradiation is demonstrated. The mean values of L αm and L cm crystallite dimensions are determined. Radiation defects, occuring in some crystallites after irradiation are revealed by the dark-field electron microscopy method

  13. Transmission electron microscopic method for gene mapping on polytene chromosomes by in situ hybridization

    OpenAIRE

    Wu, Madeline; Davidson, Norman

    1981-01-01

    A transmission electron microscope method for gene mapping by in situ hybridization to Drosophila polytene chromosomes has been developed. As electron-opaque labels, we use colloidal gold spheres having a diameter of 25 nm. The spheres are coated with a layer of protein to which Escherichia coli single-stranded DNA is photochemically crosslinked. Poly(dT) tails are added to the 3' OH ends of these DNA strands, and poly(dA) tails are added to the 3' OH ends of a fragmented cloned Drosophila DN...

  14. Calculations of Photoemission from Rutile

    Science.gov (United States)

    Hjalmarson, Harold; Schultz, Peter; Moore, Chris

    2015-03-01

    Photoemission is a well-known mechanism for release of electrons from a surface during electrical breakdown of a gas such as air. During air breakdown, UV photons, which are emitted from the highly excited gas molecules, are absorbed in the surfaces such as the cathode and the anode. These absorbed photons create energetic electrons, and a small portion of these electrons reach the surface. Those that overcome the potential energy barrier at the surface tend to be emitted. In this talk, the Boltzmann equation that describes these phenomena is formulated. A Monte Carlo probabilistic method is used to obtain the rate of electron emission as a function of photon energy. The role of bandstructure effects will be discussed. This bandstructure information is obtained by using a density-functional theory (DFT) method. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.

  15. Record number (11 000) of interference fringes obtained by a 1 MV field-emission electron microscope

    International Nuclear Information System (INIS)

    Akashi, Tetsuya; Harada, Ken; Matsuda, Tsuyoshi; Kasai, Hiroto; Tonomura, Akira; Furutsu, Tadao; Moriya, Noboru; Yoshida, Takaho; Kawasaki, Takeshi; Kitazawa, Koichi; Koinuma, Hideomi

    2002-01-01

    An electron biprism for a 1 million-volt field-emission electron microscope was developed. This biprism is controlled similarly as a specimen holder so that it can be driven and rotated precisely and is tough against mechanical vibration and stray magnetic field. We recorded the maximum number of interference fringes by using this biprism in order to confirm the overall performance as a holography electron microscope, and obtained a world record of 11,000 interference fringes

  16. Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

    International Nuclear Information System (INIS)

    LaGrange, Thomas; Campbell, Geoffrey H.; Reed, B.W.; Taheri, Mitra; Pesavento, J. Bradley; Kim, Judy S.; Browning, Nigel D.

    2008-01-01

    Most biological processes, chemical reactions and materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods in transmission electron microscopes (TEM). Thus, there is a need to increase the temporal resolution in order to capture and understand salient features of these rapid materials processes. This paper details the development of a high-time resolution dynamic transmission electron microscope (DTEM) that captures dynamics in materials with nanosecond time resolution. The current DTEM performance, having a spatial resolution <10 nm for single-shot imaging using 15 ns electron pulses, will be discussed in the context of experimental investigations in solid state reactions of NiAl reactive multilayer films, the study of martensitic transformations in nanocrystalline Ti and the catalytic growth of Si nanowires. In addition, this paper will address the technical issues involved with high current, electron pulse operation and the near-term improvements to the electron optics, which will greatly improve the signal and spatial resolutions, and to the laser system, which will allow tailored specimen and photocathode drive conditions

  17. Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)

    Energy Technology Data Exchange (ETDEWEB)

    LaGrange, Thomas [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States)], E-mail: lagrange@llnl.gov; Campbell, Geoffrey H.; Reed, B.W.; Taheri, Mitra; Pesavento, J. Bradley [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States); Kim, Judy S.; Browning, Nigel D. [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94550 (United States); Department of Chemical Engineering and Materials Science, University of California, One Shields Avenue, Davis, CA 95616 (United States)

    2008-10-15

    Most biological processes, chemical reactions and materials dynamics occur at rates much faster than can be captured with standard video rate acquisition methods in transmission electron microscopes (TEM). Thus, there is a need to increase the temporal resolution in order to capture and understand salient features of these rapid materials processes. This paper details the development of a high-time resolution dynamic transmission electron microscope (DTEM) that captures dynamics in materials with nanosecond time resolution. The current DTEM performance, having a spatial resolution <10 nm for single-shot imaging using 15 ns electron pulses, will be discussed in the context of experimental investigations in solid state reactions of NiAl reactive multilayer films, the study of martensitic transformations in nanocrystalline Ti and the catalytic growth of Si nanowires. In addition, this paper will address the technical issues involved with high current, electron pulse operation and the near-term improvements to the electron optics, which will greatly improve the signal and spatial resolutions, and to the laser system, which will allow tailored specimen and photocathode drive conditions.

  18. Aberration correction in photoemission microscopy and applications in photonics and plasmonics

    Energy Technology Data Exchange (ETDEWEB)

    Koenenkamp, Rolf [Portland State Univ., Portland, OR (United States)

    2017-09-28

    We report on the design, assembly, operation and application of an aberration-corrected photoemission electron microscope. The instrument used novel hyperbolic mirror-correctors with two and three electrodes that allowed simultaneous correction of spherical and chromatic aberrations. A spatial resolution of 5.4nm was obtained with this instrument in 2009, and 4.7nm in subsequent years. New imaging methodology was introduced involving interferometric imaging of light diffraction. This methodology was applied in nano-photonics and in the characterization of surface-plasmon polaritons. Photonic crystals and waveguides, optical antennas and new plasmonic devices such as routers, localizers and filters were designed and demonstrated using the new capabilities offered by the microscope.

  19. Characterization of electron microscopes with binary pseudo-random multilayer test samples

    Science.gov (United States)

    Yashchuk, Valeriy V.; Conley, Raymond; Anderson, Erik H.; Barber, Samuel K.; Bouet, Nathalie; McKinney, Wayne R.; Takacs, Peter Z.; Voronov, Dmitriy L.

    2011-09-01

    Verification of the reliability of metrology data from high quality X-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays has been suggested [1,2] and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer [5]. Here we describe the details of development of binary pseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi 2/Si multilayer coating with pseudo-randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML test samples can be used to characterize X-ray microscopes. Corresponding work with X-ray microscopes is in progress.

  20. Characterization of electron microscopes with binary pseudo-random multilayer test samples

    International Nuclear Information System (INIS)

    Yashchuk, Valeriy V.; Conley, Raymond; Anderson, Erik H.; Barber, Samuel K.; Bouet, Nathalie; McKinney, Wayne R.; Takacs, Peter Z.; Voronov, Dmitriy L.

    2011-01-01

    Verification of the reliability of metrology data from high quality X-ray optics requires that adequate methods for test and calibration of the instruments be developed. For such verification for optical surface profilometers in the spatial frequency domain, a modulation transfer function (MTF) calibration method based on binary pseudo-random (BPR) gratings and arrays has been suggested and proven to be an effective calibration method for a number of interferometric microscopes, a phase shifting Fizeau interferometer, and a scatterometer [5]. Here we describe the details of development of binary pseudo-random multilayer (BPRML) test samples suitable for characterization of scanning (SEM) and transmission (TEM) electron microscopes. We discuss the results of TEM measurements with the BPRML test samples fabricated from a WiSi 2 /Si multilayer coating with pseudo-randomly distributed layers. In particular, we demonstrate that significant information about the metrological reliability of the TEM measurements can be extracted even when the fundamental frequency of the BPRML sample is smaller than the Nyquist frequency of the measurements. The measurements demonstrate a number of problems related to the interpretation of the SEM and TEM data. Note that similar BPRML test samples can be used to characterize X-ray microscopes. Corresponding work with X-ray microscopes is in progress.

  1. Irradiation-related amorphization and crystallization: In situ transmission electron microscope studies

    International Nuclear Information System (INIS)

    Allen, C.W.

    1994-01-01

    Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. At present there are twelve such installations in Japan, one in France and one in the US. This paper treats several aspects of in situ studies involving electron and ion beam induced and enhanced phase transformations and presents results of several in situ experiments to illustrate the dynamics of this approach in the materials science of irradiation effects. The paper describes the ion- and electron-induced amorphization of CuTi; the ion-irradiation-enhanced transformation of TiCr 2 ; and the ion- and electron-irradiation-enhanced crystallization of CoSi 2

  2. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope.

    Science.gov (United States)

    Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

    2016-08-01

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  3. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Li, Meng; Xu, Chunkai, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn; Zhang, Panke; Li, Zhean; Chen, Xiangjun, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn [Hefei National Laboratory for Physical Science at Microscale and Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026 (China)

    2016-08-15

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  4. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

    International Nuclear Information System (INIS)

    Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

    2016-01-01

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  5. Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope

    Science.gov (United States)

    Qian, Hui; Egerton, Ray F.

    2017-11-01

    Energy-filtered transmission electron microscopy and electron tomography were applied to in situ studies of the formation, shape, and diameter of nanopores formed in a silicon nitride membrane in a transmission electron microscope. The nanopore geometry was observed in three dimensions by electron tomography. Drilling conditions, such as probe current, beam convergence angle, and probe position, affect the formation rate and the geometry of the pores. With a beam convergence semi-angle of α = 22 mrad, a conical shaped nanopore is formed but at α = 45 mrad, double-cone (hourglass-shaped) nanopores were produced. Nanopores with an effective diameter between 10 nm and 1.8 nm were fabricated by controlling the drilling time.

  6. Top-down topography of deeply etched silicon in the scanning electron microscope

    International Nuclear Information System (INIS)

    Wells, Oliver C.; Murray, Conal E.; Rullan, Jonathan L.; Gignac, Lynne M.

    2004-01-01

    It is proposed to measure the cross sections of steep-sided etched lines and similar deep surface topography on partially completed silicon integrated circuit wafers using either the backscattered electron (BSE) or the low-loss electron (LLE) image in the scanning electron microscope (SEM). These images contain regions where the collected signal is zero because there is no direct line of sight between the landing point of the electron beam on the specimen and the BSE or LLE detector. It is proposed to use the boundary of such a region in the SEM image as a geometrical line to measure the surface topography. Or alternatively, a shadow can be seen in the distribution of either BSE or LLE with an image-forming detector system. The use of this shadow position on the detector to measure deep surface topography will be demonstrated

  7. Multi-technique application of a double reflection electron emission microscope

    International Nuclear Information System (INIS)

    Jian-liang, J.; Bao-gui, S.; Guo-jun, Z

    2002-01-01

    Full text: In this paper the results acquired with the most recently developed double reflection electron emission microscope applied in different imaging modes are presented. The novel illumination system is based on a (100)-oriented single crystalline W wire electron microreflector and an electron gun placed in the back focal plane of the immersion objective. After being elastically reflected from the W tip surface, the primary electrons of energy ranging from 1 to 6 keV are decelerated to the desired impact energy in the range 0 to 200 eV for mirror electron microscopy (MEM), low energy electron emission microscopy (LEEM) and low energy electron diffraction (LEED) modes or to 5 keV for the secondary electron imaging mode. Photoelectron emission microscopy (PEEM), MEM, LEEM, secondary images of Pd/Si(111) and a set of selected area LEED patterns of the W(100) surface taken at energies ranging from 5 to 40 eV are presented for the first time. Copyright (2002) Australian Society for Electron Microscopy Inc

  8. Use of an axisymmetric microscope with electronic readout for collecting soft X-ray images

    International Nuclear Information System (INIS)

    Cavailler, C.; Henry, P.; Launspach, J.; De Mascureau, J.; Millerioux, M.; Rostaing, M.; Sauneuf, R.

    1984-08-01

    The axisymmetric microscope, first discussed by Wolter, provides high resolution and sensitivity for investigating the soft X-ray emission of laser-driven plasmas. Such a device having a 10 X magnification has been constructed. We present a comparison between the images of laser-driven plasmas given by this microscope and by a 10 X pinhole camera. Until now these images were recorded on X-ray film. We have shown that film could be replaced by C.C.D. in a pinhole camera when the photon energy lies within the 1-10 keV range. Below 1 keV the quantum yield is too low so we have used an image converter tube made by RTC. It is a diode-inverter tube with a soft X-ray photocathode and a P20 phosphor deposited on an optic fiber plate. The electronic image appearing on the screen is read by a C.C.D. working in the visible spectral fields. An electronic image readout chain, which is identical to those associated with streak cameras, then processes automatically and immediately the images given by the microscope [fr

  9. Study of skin of an Egyptian mummy using a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Mańkowska-Pliszka Hanna

    2017-06-01

    Full Text Available The first study of modified human remains using an electron microscope was carried out at the end of the 1950 and in 1979 the first result of the study involving a scanning electron microscope (SEM was published for the first time. The study was mainly focused on the structure of tissues and cells. With the help of this technique cell and tissue elements, viruses and bacterial endospores as well as the structure of epithelium and the collagen contents of dermis were identified and described. In the above-mentioned case the object of the study using a SEM was a free part of the right hand (forearm with the dorsal and palmar parts of hand of unknown origin, with signs of mummification revealed during microscopic analysis. Our study was aimed at finding the answer to the question if the mummification of the studied limb was natural or intentional, and if the study using a SEM could link the anonymous remains with ancient Egypt.

  10. Electron microscopic study of the spilt irradiation effects on the rat parotid ductal cells

    International Nuclear Information System (INIS)

    Kim, Sung Soo; Lee, Sang Rae

    1988-01-01

    This study was designed to investigate the effects of split irradiation on the salivary ductal cells, especially on the intercalated cells of the rat parotid glands. For this study, 24 Sprague-Dawley strain rats were irradiated on the head and neck region with two equal split doses of 9 Gy for a 4 hours interval by Co-60 teletherapy unit, Picker's mode l 4M 60. The conditions of irradiation were that field size, dose rate, SSD and depth were 12 X 5 cm, 222 cGy/min, 50 cm and 1 cm, respectively. The experimental animals were sacrificed 1, 2, 3, 6, 12, hours and 1, 3, 7, days after the irradiation and the changes of the irradiated intercalated cells of the parotid glands were examined under light and electron microscope. The results were as follows: 1. By the split irradiation, the degenerative changes of intercalated cells of the parotid glands appeared at 3 hours after irradiation and the most severe cellular degeneration observed at 6 hours after irradiation. The repair processes began from 12 hours after irradiation and have matured progressively. 2. Under electron microscope, loss of nuclear membrane, microvilli and secretory granules, derangement of chromosomes, degeneration of cytoplasm, atrophy or reduction of intracytoplasmic organelles were observed in the intercalated ductal cells after split irradiation. 3. Under light microscope, derangement of ductal cells, widening of cytoplasms and nuclei, hyperchromatism and proliferation of ductal cells were observed in intercalated ducts after split irradiation.

  11. Modeling secondary electron emission from nanostructured materials in helium ion microscope

    International Nuclear Information System (INIS)

    Ohya, K.; Yamanaka, T.

    2013-01-01

    Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

  12. A scanning electron microscopic study of 34 cases of acute granulocytic, myelomonocytic, monoblastic and histiocytic leukemia.

    Science.gov (United States)

    Polliack, A; McKenzie, S; Gee, T; Lampen, N; de Harven, E; Clarkson, B D

    1975-09-01

    This report describes the surface architecture of leukemic cells, as seen by scanning electron microscopy in 34 patients with acute nonlymphoblastic leukemia. Six patients with myeloblastic, 4 with promyelocytic, 10 with myelomonocytic, 8 with monocytic, 4 with histiocytic and 2 with undifferentiated leukemia were studied. Under the scanning electron microscope most leukemia histiocytes and monocytes appeared similar and were characterized by the presence of large, well developed broad-based ruffled membranes or prominent raised ridge-like profiles, resembling ithis respect normal monocytes. Most cells from patients with acute promyelocytic or myeloblastic leukemia exhibited narrower ridge-like profiles whereas some showed ruffles or microvilli. Patients with myelomonocytic leukemia showed mixed populations of cells with ridge-like profiles and ruffled membranes whereas cells from two patients with undifferentiated leukemia had smooth surfaces, similar to those encountered in cells from patients with acute lymphoblastic leukemia. It appears that nonlymphoblastic and lymphoblastic leukemia cells (particularly histiocytes and monocytes) can frequently be distinquished on the basis of their surface architecture. The surface features of leukemic histiocytes and monocytes are similar, suggesting that they may belong to the same cell series. The monocytes seem to have characteristic surface features recognizable with the scanning electron microscope and differ from most cells from patients with acute granulocytic leukemia. Although overlap of surface features and misidentification can occur, scanning electron microscopy is a useful adjunct to other modes of microscopy in the study and diagnosis of acute leukemia.

  13. Design and implementation of a fs-resolved transmission electron microscope based on thermionic gun technology

    Energy Technology Data Exchange (ETDEWEB)

    Piazza, L., E-mail: luca.piazza@epfl.ch [Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), ICMP, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne (Switzerland); Masiel, D.J. [Integrated Dynamic Electron Solutions, Inc., 455 Bolero Drive, Danville, CA 94526 (United States); LaGrange, T.; Reed, B.W. [Condensed Matter and Materials Division Physical and Life Sciences Directorate, Lawrence Livermore National Laboratory, P.O. Box 808, L-356, Livermore, CA 94550 (United States); Barwick, B. [Department of Physics, Trinity College, 300 Summit St., Hartford, CT 06106 (United States); Carbone, Fabrizio [Laboratory for Ultrafast Microscopy and Electron Scattering (LUMES), ICMP, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne (Switzerland)

    2013-09-23

    Highlights: • We present the implementation of a femtosecond-resolved ultrafast TEM. • This is the first ultrafast TEM based on a thermionic gun geometry. • An additional condenser lens has been used to maximize the electron count. • We achieved a time resolution of about 300 fs and an energy resolution of 1 eV. - Abstract: In this paper, the design and implementation of a femtosecond-resolved ultrafast transmission electron microscope is presented, based on a thermionic gun geometry. Utilizing an additional magnetic lens between the electron acceleration and the nominal condenser lens system, a larger percentage of the electrons created at the cathode are delivered to the specimen without degrading temporal, spatial and energy resolution significantly, while at the same time maintaining the femtosecond temporal resolution. Using the photon-induced near field electron microscopy effect (PINEM) on silver nanowires the cross-correlation between the light and electron pulses was measured, showing the impact of the gun settings and initiating laser pulse duration on the electron bunch properties. Tuneable electron pulses between 300 fs and several ps can be obtained, and an overall energy resolution around 1 eV was achieved.

  14. Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms

    International Nuclear Information System (INIS)

    Zemlin, F.; Weiss, K.; Schiske, P.; Kunath, W.; Herrmann, K.-H.

    1978-01-01

    Alignment by means of current commutating and defocusing of the objective does not yield the desired rotational symmetry of the imaging pencils. This was found while aligning a transmission electron microscope with a single field condenser objective. A series of optical diffractograms of micrographs taken under the same tilted illumination yet under various azimuths have been arranged in a tableau, wherein strong asymmetry is exhibited. Quantitative evaluation yields the most important asymmetric aberration to be the axial coma, which becomes critical when a resolution better than 5 A 0 is obtained. The tableau also allows an assessment of the three-fold astigmatism. A procedure has been developed which aligns the microscope onto the coma-free and dispersion-free pencil axis and does not rely on current communication. The procedure demands equal appearance of astigmatic carbon film images produced under the same tilt yet diametrical azimuth. (Auth.)

  15. Analytical electron microscope study of the omega phase transformation in a zirconium--niobium alloy

    Energy Technology Data Exchange (ETDEWEB)

    Zaluzec, N.J.

    1979-06-01

    An in-situ study of the as-quenched omega phase transformation in Zr--15% Nb was conducted between the temperatures of 77 and 300/sup 0/K using analytical electron microscopy. The domain size of the omega regions observed in this investigation was on the order of 30 A, consistent with previous observations in this system. No alignment of omega domains along <222> directions of the bcc lattice was observed and in-situ thermal cycling experiments failed to produce a long period structure of alternating ..beta.. and ..omega.. phase regions as predicted by one theory of this transformation. Several techniques of microstructural analysis were developed, refined, and standardized. Grouped under the general classification of Analytical Electron Microscopy (AEM) they provide the experimentalist with a unique tool for the microcharacterization of solids, allowing semiquantitative to quantitative analysis of the morphology, crystallography, elemental composition, and electronic structure of regions as small as 20 A in diameter. These techniques have complications, and it was necessary to study the AEM system used in this work so that instrumental artifacts which invalidate the information produced in the microscope environment might be eliminated. Once these factors had been corrected, it was possible to obtain a wealth of information about the microvolume of material under investigation. The microanalytical techniques employed during this research include: energy dispersive x-ray spectroscopy (EDS) using both conventional and scanning transmission electron microscopy (CTEM, STEM), transmission scanning electron diffraction (TSED), the stationary diffraction pattern technique, and electron energy loss spectroscopy (ELS) using a dedicated scanning transmission electron microscope (DSTEM).

  16. Analytical electron microscope study of the omega phase transformation in a zirconium--niobium alloy

    International Nuclear Information System (INIS)

    Zaluzec, N.J.

    1979-06-01

    An in-situ study of the as-quenched omega phase transformation in Zr--15% Nb was conducted between the temperatures of 77 and 300 0 K using analytical electron microscopy. The domain size of the omega regions observed in this investigation was on the order of 30 A, consistent with previous observations in this system. No alignment of omega domains along directions of the bcc lattice was observed and in-situ thermal cycling experiments failed to produce a long period structure of alternating β and ω phase regions as predicted by one theory of this transformation. Several techniques of microstructural analysis were developed, refined, and standardized. Grouped under the general classification of Analytical Electron Microscopy (AEM) they provide the experimentalist with a unique tool for the microcharacterization of solids, allowing semiquantitative to quantitative analysis of the morphology, crystallography, elemental composition, and electronic structure of regions as small as 20 A in diameter. These techniques have complications, and it was necessary to study the AEM system used in this work so that instrumental artifacts which invalidate the information produced in the microscope environment might be eliminated. Once these factors had been corrected, it was possible to obtain a wealth of information about the microvolume of material under investigation. The microanalytical techniques employed during this research include: energy dispersive x-ray spectroscopy (EDS) using both conventional and scanning transmission electron microscopy (CTEM, STEM), transmission scanning electron diffraction (TSED), the stationary diffraction pattern technique, and electron energy loss spectroscopy (ELS) using a dedicated scanning transmission electron microscope

  17. The interperiosteo-dural concept applied to the perisellar compartment: a microanatomical and electron microscopic study.

    Science.gov (United States)

    François, Patrick; Travers, Nadine; Lescanne, Emmanuel; Arbeille, Brigitte; Jan, Michel; Velut, Stéphane

    2010-11-01

    The dura mater has 2 dural layers: the endosteal layer (outer layer), which is firmly attached to the bone, and the meningeal layer (inner layer), which directly covers the brain. These 2 dural layers join together in the middle temporal fossa or the convexity and separate into the orbital, lateral sellar compartment (LSC), or spinal epidural space to form the extradural neural axis compartment (EDNAC). The aim of this work was to anatomically verify the concept of the EDNAC by using electron microscopy. The authors studied the cadaveric heads obtained from 13 adults. Ten of the specimens (or 20 perisellar areas) were injected with colored latex and fixed in formalin. They carefully removed each brain to allow a superior approach to the perisellar area. The 3 other specimens were studied by microscopic and ultrastructural methods to describe the EDNAC in the perisellar area. Special attention was paid to the dural layers surrounding the perisellar area. The authors studied the anatomy of the meningeal architecture of the LSC, the petroclival venous confluence, the orbit, and the trigeminal cave. After dissection, the authors took photographs of the dural layers with the aid of optical magnification. The 3 remaining heads, obtained from fresh cadavers, were prepared for electron microscopic study. The EDNAC is limited by the endosteal layer and the meningeal layer and contains fat and/or venous blood. The endosteal layer and meningeal layer were not identical on electron microscopy; this finding can be readily related to the histology of the meninges. In this study, the authors demonstrated the existence of the EDNAC concept in the perisellar area by using dissected cadaveric heads and verified the reality of the concept of the meningeal layer with electron microscopy. These findings clearly demonstrated the existence of the EDNAC, a notion that has generally been accepted but never demonstrated microscopically.

  18. Surface and bulk 4f-photoemission spectra of CeIn3 and CeSn3

    International Nuclear Information System (INIS)

    Kim, H.; Tjernberg, O.; Chiaia, G.; Kumigashira, H.; Takahashi, T.; Duo, L.; Sakai, O.; Kasaya, M.; Lindau, I.

    1997-01-01

    Resonant photoemission spectroscopy was performed on CeIn 3 and CeSn 3 at the 4d-4f and 3d-4f core thresholds. Using the different surface sensitivity between the two photon energies, surface and bulk 4f-photoemission spectra were derived for both compounds. With the noncrossing approximation of the Anderson impurity model, the 4d-4f resonant spectra together with the surface and bulk spectra were self-consistently analyzed to obtain the microscopic parameters such as the 4f-electron energy and the hybridization strength with conduction electrons. The result shows a substantial difference in these parameters between the surface and the bulk, indicating that it is important to take into account the surface effect in analyzing photoemission spectra of Ce compounds. It is also found that the 4f surface core-level shift is different between CeIn 3 and CeSn 3 . copyright 1997 The American Physical Society

  19. In Situ Room Temperature Electron-Beam Driven Graphene Growth from Hydrocarbon Contamination in a Transmission Electron Microscope

    Directory of Open Access Journals (Sweden)

    Mark H Rummeli

    2018-05-01

    Full Text Available The excitement of graphene (as well as 2D materials in general has generated numerous procedures for the fabrication of graphene. Here we present a mini-review on a rather less known, but attractive, in situ means to fabricate graphene inside a transmission electron microscope (TEM. This is achieved in a conventional TEM (viz. no sophisticated specimen holders or microscopes are required and takes advantage of inherent hydrocarbon contamination as a carbon source. Both catalyst free and single atom catalyst approaches are reviewed. An advantage of this technique is that not only can the growth process be imaged in situ, but this can also be achieved with atomic resolution. Moreover, in the future, one can anticipate such approaches enabling the growth of nano-materials with atomic precision.

  20. Light and electron microscopic localization of GABAA-receptors on cultured cerebellar granule cells and astrocytes using immunohistochemical techniques

    DEFF Research Database (Denmark)

    Hansen, Gert Helge; Hösli, E; Belhage, B

    1991-01-01

    . At the light microscope level specific staining of GABAA-receptors was localized in various types of neurones in explant cultures of rat cerebellum using the indirect peroxidase-antiperoxidase (PAP) technique, whereas no specific staining was found in astrocytes. At the electron microscope level labeling...

  1. Investigation of the electron dynamics of Si(111) 7 x 7 and development of a time-of-flight spectrometer for time- and angle-resolved two-photon photoemission

    International Nuclear Information System (INIS)

    Damm, Andreas

    2011-01-01

    This thesis consists of two main parts. The first one reports about recent investigations of the electron dynamics on the Si(111) 7 x 7 surface employing time- and angle-resolved two-photon photoemission (2PPE). The second part describes the construction and demonstration of the capabilities of a new electron time-of-flight spectrometer. It is shown that the electron dynamics of this surface are governed by adatom and bulk states. Variation of different experimental parameters leads to the suggestion that electrons scatter from the adatom states into the conduction band of Silicon. The localization in real space can be estimated from the distribution of the photoemission intensity in momentum space to be within one 7 x 7 unit cell. The electron population in the conduction band as well as those in the adatom band show a very long-living component. In addition to recombination through defect states, these electrons can undergo radiative recombination with holes in the valence band. The second part of this thesis reports about the design, construction and demonstration of the capabilities of a new electron time-of-flight spectrometer for applications in time- and angle-resolved 2PPE experiments. The new spectrometer is designed in a flexible manner to maximize either the energy resolution or the acceptance angle, respectively. By employing a position-sensitive electron detector it is possible for the first time to measure the energy as well as all components of the parallel momentum of the photoemitted electrons and thereby to fully characterize electrons from surface states. The time-resolution can be estimated from the width of a peak induced by photons scattered from the sample to be better than 150 ps. At the minimum of about 40 mm of the adjustable drift distance this leads to a energy resolution below 5 meV for electrons with kinetic energies of 1 eV. Thereby, the parallel momentum resolution is below 5 mA -1 for parallel momentum values k parallel ≤1A -1

  2. Atomistic observations and analyses of lattice defects in transmission electron microscopes

    CERN Document Server

    Abe, H

    2003-01-01

    The transmission electron microscope (TEM) -accelerators was developed. TEM-Accelerator made possible to observe in situ experiments of ion irradiation and implantation. The main results are the experimental proof of new lattice defects by irradiation, the formation process and synthesized conditions of carbon onion by ion implantation, the microstructure and phase transformation conditions of graphite by ion irradiated phase transformation, the irradiation damage formation process by simultaneous irradiation of electron and ion and behavior of fullerene whisker under irradiation. The microstructural evolution of defect clusters in copper irradiated with 240-keV Cu sup + ions and a high resolution electron micrograph of carbon onions synthesized by ion implantation are explained as the examples of recent researches. (S.Y.)

  3. High-speed multi-frame dynamic transmission electron microscope image acquisition system with arbitrary timing

    Science.gov (United States)

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2016-02-23

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.

  4. High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

    Science.gov (United States)

    Reed, Bryan W.; DeHope, William J.; Huete, Glenn; LaGrange, Thomas B.; Shuttlesworth, Richard M.

    2015-10-20

    An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system ("laser"). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.

  5. Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope.

    Science.gov (United States)

    Trevethan, Thomas; Shluger, Alexander

    2009-07-01

    We present the results of theoretical modelling that predicts how a process of transfer of single electrons between two defects on an insulating surface can be induced using a scanning force microscope tip. A model but realistic system is employed which consists of a neutral oxygen vacancy and a noble metal (Pt or Pd) adatom on the MgO(001) surface. We show that the ionization potential of the vacancy and the electron affinity of the metal adatom can be significantly modified by the electric field produced by an ionic tip apex at close approach to the surface. The relative energies of the two states are also a function of the separation of the two defects. Therefore the transfer of an electron from the vacancy to the metal adatom can be induced either by the field effect of the tip or by manipulating the position of the metal adatom on the surface.

  6. Probing plasmons in three dimensions by combining complementary spectroscopies in a scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Hachtel, J A; Haglund, R F; Pantelides, S T; Marvinney, C; Mayo, D; Mouti, A; Lupini, A R; Chisholm, M F; Mu, R; Pennycook, S J

    2016-01-01

    The nanoscale optical response of surface plasmons in three-dimensional metallic nanostructures plays an important role in many nanotechnology applications, where precise spatial and spectral characteristics of plasmonic elements control device performance. Electron energy loss spectroscopy (EELS) and cathodoluminescence (CL) within a scanning transmission electron microscope have proven to be valuable tools for studying plasmonics at the nanoscale. Each technique has been used separately, producing three-dimensional reconstructions through tomography, often aided by simulations for complete characterization. Here we demonstrate that the complementary nature of the two techniques, namely that EELS probes beam-induced electronic excitations while CL probes radiative decay, allows us to directly obtain a spatially- and spectrally-resolved picture of the plasmonic characteristics of nanostructures in three dimensions. The approach enables nanoparticle-by-nanoparticle plasmonic analysis in three dimensions to aid in the design of diverse nanoplasmonic applications. (paper)

  7. Device intended for measurement of induced trapped charge in insulating materials under electron irradiation in a scanning electron microscope

    International Nuclear Information System (INIS)

    Belkorissat, R; Benramdane, N; Jbara, O; Rondot, S; Hadjadj, A; Belhaj, M

    2013-01-01

    A device for simultaneously measuring two currents (i.e. leakage and displacement currents) induced in insulating materials under electron irradiation has been built. The device, suitably mounted on the sample holder of a scanning electron microscope (SEM), allows a wider investigation of charging and discharging phenomena that take place in any type of insulator during its electron irradiation and to determine accurately the corresponding time constants. The measurement of displacement current is based on the principle of the image charge due to the electrostatic influence phenomena. We are reporting the basic concept and test results of the device that we have built using, among others, the finite element method for its calibration. This last method takes into account the specimen chamber geometry, the geometry of the device and the physical properties of the sample. In order to show the possibilities of the designed device, various applications under different experimental conditions are explored. (paper)

  8. Electronic structure of charge-density-wave state in quasi-2D KMo6O17 purple bronze characterized by angle resolved photoemission spectroscopy

    Science.gov (United States)

    Valbuena, M. A.; Avila, J.; Drouard, S.; Guyot, H.; Asensio, M. C.

    2006-01-01

    We report on an angle-resolved-photoemission spectroscopy (ARPES) investigation of layered quasi-two dimensional (2D) Molybdenum purple bronze KMo6O17 in order to study and characterizes the transition to a charge-density-wave (CDW) state. We have performed photoemission temperature dependent measurements cooling down from room temperature (RT) to 32 K, well below the Peierls transition for this material, with CDW transition temperature Tc =110 K. The spectra have been taken at a selected kF point of the Fermi surface (FS) that satisfies the nesting condition of the FS, looking for the characteristic pseudo-gap opening in this kind of materials. The pseudogap has been estimated and it result to be in agreement with our previous works. The shift to lower binding energy of crossing Fermi level ARPES feature have been also confirmed and studied as a function of temperature, showing a rough like BCS behaviour. Finally we have also focused on ARPES measurements along ΓM¯ high symmetry direction for both room and low temperature states finding some insight for ‘shadow’ or back folded bands indicating the new periodicity of real lattice after the CDW lattice distortion.

  9. Enhanced thermal stability of a polymer solar cell blend induced by electron beam irradiation in the transmission electron microscope.

    Science.gov (United States)

    Bäcke, Olof; Lindqvist, Camilla; de Zerio Mendaza, Amaia Diaz; Gustafsson, Stefan; Wang, Ergang; Andersson, Mats R; Müller, Christian; Kristiansen, Per Magnus; Olsson, Eva

    2017-05-01

    We show by in situ microscopy that the effects of electron beam irradiation during transmission electron microscopy can be used to lock microstructural features and enhance the structural thermal stability of a nanostructured polymer:fullerene blend. Polymer:fullerene bulk-heterojunction thin films show great promise for use as active layers in organic solar cells but their low thermal stability is a hindrance. Lack of thermal stability complicates manufacturing and influences the lifetime of devices. To investigate how electron irradiation affects the thermal stability of polymer:fullerene films, a model bulk-heterojunction film based on a thiophene-quinoxaline copolymer and a fullerene derivative was heat-treated in-situ in a transmission electron microscope. In areas of the film that exposed to the electron beam the nanostructure of the film remained stable, while the nanostructure in areas not exposed to the electron beam underwent large phase separation and nucleation of fullerene crystals. UV-vis spectroscopy shows that the polymer:fullerene films are stable for electron doses up to 2000kGy. Copyright © 2016 Elsevier B.V. All rights reserved.

  10. Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfaces

    International Nuclear Information System (INIS)

    Wadati, H.; Fujimori, A.

    2013-01-01

    Highlights: •Photoemission spectroscopy is a powerful technique to study the electronic structures of transition-metal oxides. •Hard X-ray photoemission spectroscopy (HXPES) is a new type of photoemission spectroscopy which can probe bulk states. •HXPES is very suitable for studying oxide thin films such as the composition dependence and the film thickness dependence. -- Abstract: Photoemission spectroscopy is a powerful experimental technique to study the electronic structures of solids, especially of transition-metal oxides. Recently, hard X-ray photoemission spectroscopy (HXPES) has emerged as a more relevant experimental technique to obtain clear information about bulk states. Here, we describe how HXPES can be conveniently applied to study the interesting subjects on oxide thin films such as the composition dependence and the film thickness dependence of the electronic structures and the interfacial electronic structure of multilayers

  11. Portable spectroscopic scanning electron microscope on ISS: in situ nanostructural/chemical analysis for critical vehicle systems, Phase I

    Data.gov (United States)

    National Aeronautics and Space Administration — We will construct a novel field-portable miniature analytical electron microscope (EM+EDS) called Mochii "S" for in situ sensing in harsh/remote environments such as...

  12. The objective lens of the electron microscope with correction of spherical and axial chromatic aberrations.

    Science.gov (United States)

    Bimurzaev, S B; Aldiyarov, N U; Yakushev, E M

    2017-10-01

    The paper describes the principle of operation of a relatively simple aberration corrector for the transmission electron microscope objective lens. The electron-optical system of the aberration corrector consists of the two main elements: an electrostatic mirror with rotational symmetry and a magnetic deflector formed by the round-shaped magnetic poles. The corrector operation is demonstrated by calculations on the example of correction of basic aberrations of the well-known objective lens with a bell-shaped distribution of the axial magnetic field. Two of the simplest versions of the corrector are considered: a corrector with a two-electrode electrostatic mirror and a corrector with a three-electrode electrostatic mirror. It is shown that using the two-electrode mirror one can eliminate either spherical or chromatic aberration of the objective lens, without changing the value of its linear magnification. Using a three-electrode mirror, it is possible to eliminate spherical and chromatic aberrations of the objective lens simultaneously, which is especially important in designing electron microscopes with extremely high resolution. © The Author 2017. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  13. Follicle and oocyte growth in early postnatal calves: cytochemical, autoradiographical and electron microscopical studies

    International Nuclear Information System (INIS)

    Mhawi, A.J.; Kaňka, J.; Motlík, J.

    1991-01-01

    The initiation of oocyte and follicle growth was studied in 1- and 3-d-old calf ovaries using cytochemical, autoradiographical and electron microscopical approaches. Attention was only paid to unilaminar ovarian follicles that were classified into 3 categories: unilaminar flattened (UF), unilaminar flatto-cuboidal (UFC) and unilaminar cuboidal (UC) ovarian follicles when the oocyte was surrounded by 1 layer of flattened, a mixture of flattened and cuboidal and entirely cuboidal follicle cells, respectively. Our findings suggested that oocytes within each of these follicle categories were in different developmental stages. Furthermore, electron microscopic observations revealed that early after birth, oocyte nuclei characteristic of diplotene configuration (aggregation of the nuclear chromatin into moderately electron-dense small patches and fibrillo-granular texture of the nucleolus) were encountered in 41% of the UF follicles. The rest of the UF as well as all of the UFC and UC follicles were found to contain dictyate oocytes in which the chromatin was highly decondensed and the nucleolus differentiated into fibrillar, fibrillo-granular and granular components. The present results also indicated that the complete transition of the surrounding follicle cells from flattened to cuboidal shape and the morphological changes of the oocyte endoplasmic reticulum and mitochondria were 2 complementary events essential for initiation of oocyte growth

  14. Electron Microscopic Changes of Rabbit Retina after Chromovitrectomy Using Combined Dyes (Experimental Study

    Directory of Open Access Journals (Sweden)

    B. M. Aznabaev

    2018-01-01

    Full Text Available Purpose: to evaluate on experimental model electron-microscopic changes of rabbit retina after staining of the posterior eye segmentwith combined dyes based on Trypan blue and Brilliant blue G for the assessment of their safety. Methods. The study was performed onChinchilla breed rabbits. Combined dyes based on Trypan blue and Brilliant blue were used: MembraneBlue-Dual (DORC, Netherlandsand “Staining solution for ophthalmic surgery” (JCS “Optimedservis”, Russia. Standard three-port vitrectomy technique was used. After vitreous removal dyes were injected in vitreous cavity and exposed for 10 seconds and then removed. The vitreous cavity was filled by a balanced salt solution. An electron-microscopic evaluation was performed on 5, 14 and 30 days after surgery. Eyes were enucleated in 20 minutes after animal was killed by air embolization. Intact eyes were used as a control, all samples were prepared in same сonditions. The damage of the retina architectonics and the presence of intracellular inclusions were evaluated. Results. The staged character of pathomorphological changes was revealed. On the 5th day moderate edema and hydropic dystrophy of neurons were registered. On the 14th day, there was no negative dynamics. On day 30, the signs of edema and dystrophy of neurons practically disappeared, which may indicate a fundamental reversibility of the registered changes. Conclusion. Investigated dyes for staining intraocular structures based on Trypan blue and Brilliant blue did not cause significant histomorphological changes and toxic effects on retinal cell structures. Detected electron microscopic changes were insignificant, had reversible character and could be mostly caused by a surgical injury.

  15. Photoemission studies of semiconductor nanocrystals

    International Nuclear Information System (INIS)

    Hamad, K.S.; Roth, R.; Alivisatos, A.P.

    1997-01-01

    Semiconductor nanocrystals have been the focus of much attention in the last ten years due predominantly to their size dependent optical properties. Namely, the band gap of nanocrystals exhibits a shift to higher energy with decreasing size due to quantum confinement effects. Research in this field has employed primarily optical techniques to study nanocrystals, and in this respect this system has been investigated extensively. In addition, one is able to synthesize monodisperse, crystalline particles of CdS, CdSe, Si, InP, InAs, as well as CdS/HgS/CdS and CdSe/CdS composites. However, optical spectroscopies have proven ambiguous in determining the degree to which electronic excitations are interior or surface admixtures or giving a complete picture of the density of states. Photoemission is a useful technique for understanding the electronic structure of nanocrystals and the effects of quantum confinement, chemical environments of the nanocrystals, and surface coverages. Of particular interest to the authors is the surface composition and structure of these particles, for they have found that much of the behavior of nanocrystals is governed by their surface. Previously, the authors had performed x-ray photoelectron spectroscopy (XPS) on CdSe nanocrystals. XPS has proven to be a powerful tool in that it allows one to determine the composition of the nanocrystal surface

  16. Characterization of electronic structure of Cu2ZnSn(SxSe1−x)4 absorber layer and CdS/Cu2ZnSn(SxSe1−x)4 interfaces by in-situ photoemission and inverse photoemission spectroscopies

    International Nuclear Information System (INIS)

    Terada, Norio; Yoshimoto, Sho; Chochi, Kosuke; Fukuyama, Takayuki; Mitsunaga, Masahiro; Tampo, Hitoshi; Shibata, Hajime; Matsubara, Koji; Niki, Shigeru; Sakai, Noriyuki; Katou, Takuya; Sugimoto, Hiroki

    2015-01-01

    The dependences of electronic structure of CZTS x Se 1−x (CZTSSe) layers synthesized by sulfurization and/or selenization of the vacuum-deposited metal precursors on the anion mixing ratio x = S/(S + Se) have been studied by in-situ ultraviolet and X-ray photoemission spectroscopies (UPS, XPS) and inverse photoemission spectroscopy (IPES). The band alignment at interfaces between the CdS buffer by the sequential evaporation and the CZTSSe (x = 0.28 and 1.0) has also been investigated by the in-situ measurements of these spectroscopies. The UPS/IPES results of the CZTSSe surfaces have revealed linear expansion of band gap energy E g with an increase of x: E g(CZTSe;x=0) = 0.9-1.0 eV and E g(CZTS;x=1) = 1.5-1.6 eV. This expansion mainly originates in the rise of conduction band minimum CBM: CBM (CZTSe;x=0) = 0.45-0.50 eV and CBM (CZTS;x=1) = 0.95-1.05 eV. The in-situ measurements of the interface electronic structure have revealed that the CdS/CZTSSe (x = 0.28) interface has a so-called “type I” band alignment with a conduction band offset CBO about + 0.2 eV which is favorable to high cell performance. A negative CBO was distinguished for the CdS/CZTS (x = 1.0) interface, and the observed change in the band alignment with the anion mixing ratio was consistent with that of the variation in cell-performances. - Highlights: • The variation of electronic structure of CZTSSe films with S/(S + Se) ratio x is studied. • The monotonous rise of the conduction band minimum with x is clarified. • The band alignment at the CdS/CZTSSe interface is clarified by in-situ PES/IPES. • The change of the conduction band offset from positive to negative as an increase of x is observed. • The consistency between the band alignment and the cell performance is confirmed

  17. Surface characterization of activated chalcopyrite particles via the FLSmidth ROL process. Part 1: Electron microscope investigations

    DEFF Research Database (Denmark)

    Karcz, Adam Paul; Damø, Anne Juul; Illerup, Jytte Boll

    Because of its unique semiconductor properties, the world’s most abundant copper mineral (chalcopyrite) is refractory with respect to atmospheric leaching using traditional ferric sulfate lixiviants. A novel approach to address this issue – conducted at FLSmidth – utilizes a mechanochemical Rapid...... of copper(II) to dope the semiconductor lattice and thereby "activate" the chalcopyrite, thereby reducing leach times below 2 hours (>98% recovery). Because the activation plays a major role in accelerating the leaching step, it is critical to understand the nature of this intermediate and its part...... in the ROL process. The current work presents results from electron microscope investigations of surface-activated particles....

  18. Manipulation of nanoparticles of different shapes inside a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Boris Polyakov

    2014-02-01

    Full Text Available In this work polyhedron-like gold and sphere-like silver nanoparticles (NPs were manipulated on an oxidized Si substrate to study the dependence of the static friction and the contact area on the particle geometry. Measurements were performed inside a scanning electron microscope (SEM that was equipped with a high-precision XYZ-nanomanipulator. To register the occurring forces a quartz tuning fork (QTF with a glued sharp probe was used. Contact areas and static friction forces were calculated by using different models and compared with the experimentally measured force. The effect of NP morphology on the nanoscale friction is discussed.

  19. Serotonergic synaptic input to facial motoneurons: localization by electron-microscopic autoradiography

    Energy Technology Data Exchange (ETDEWEB)

    Aghajanian, G K; McCall, R B [Yale Univ., New Haven, CT (USA). School of Medicine

    1980-12-01

    Serotonergic nerve terminals in the facial motor nucleus were labelled with (/sup 3/H)5-hydroxytryptamine. When serotonergic nerve terminals were destroyed (by the selective neurotoxin 5,7-dihydroxytryptamine) the labelling was lost. By electron-microscopic autoradiography, labelled serotonergic terminals were found to make axo-dendritic or axo-somatic junctions with facial motor neurons. No axo-axonic junctions were observed. These morphological findings are consistent with physiological studies which indicate that 5-hydroxytryptamine facilitates the excitation of facial motoneurons through a direct postsynaptic action.

  20. Magnetic lens apparatus for a low-voltage high-resolution electron microscope

    Science.gov (United States)

    Crewe, Albert V.

    1996-01-01

    A lens apparatus in which a beam of charged particles of low accelerating voltage is brought to a focus by a magnetic field, the lens being situated behind the target position. The lens comprises an electrically-conducting coil arranged around the axis of the beam and a magnetic pole piece extending along the axis of the beam at least within the space surrounded by the coil. The lens apparatus comprises the sole focusing lens for high-resolution imaging in a low-voltage scanning electron microscope.