Super TOF secondary ion mass spectroscopy using very highly charged primary ions up to Th70+

International Nuclear Information System (INIS)

Briere, M.A.; Schenkel, T.; Schneider, D.

1995-01-01

The LLNL Electron Beam Ion Trap (EBIT) has made low emittance beams of slow highly charged ions available for ion-solid interaction studies. Such interactions feature the dominance of electronic over collisional effects, and the shock waves generated by the ionized target atoms can desorb large numbers of large molecular species from the surface. This paper presents the first systematic study of the sputtering process due to the incidence of slow very highly charged ions; Th 70+ ions are extracted from EBIT at 7 keV * q and directed onto thin SiO 2 films on Si. Results suggest secondary ion yields of up to 25 per incident ion for Th 70+ (secondary ion yield is increased over that for singly or moderately charged ions). Correlations of the negative, positive, and negative cluster ion yields show promise for application of highly charged ion induced sputtering for enhanced sensitivity and quantitative (absolute) SIMS analysis of deep submicron scale surface layers and polymeric and biomolecular material analysis

Imaging and Patterning on Nanometer Scale Using Coherent EUV Light

International Nuclear Information System (INIS)

Wachulak, P.W.; Fiedorowicz, H.; Bartnik, A.; Marconi, M.C.; Menoni, C.S.; Rocca, J.J.

2010-01-01

Extreme ultraviolet (EUV) covers wavelength range from about 5 nm to 50 nm. That is why EUV is especially applicable for imaging and patterning on nanometer scale length. In the paper periodic nanopatterning realized by interference lithography and high resolution holographic nanoimaging performed in a Gabor in-line scheme are presented. In the experiments a compact table top EUV laser was used. Preliminary studies on using a laser plasma EUV source for nanoimaging are presented as well. (author)

A novel ion imager for secondary ion mass spectrometry

International Nuclear Information System (INIS)

Matsumoto, Kazuya; Miyata, Kenji; Nakamura, Tsutomu

1993-01-01

This paper describes a new area detector for secondary ion mass spectrometry (SIMS) ion microscope, and its performance. The operational principle is based on detecting the change in potential of a floating photodiode caused by the ion-induced secondary-electron emission and the incoming ion itself. The experiments demonstrated that 10 1 -10 5 aluminum ions per pixel can be detected with good linear response. Moreover, relative ion sensitivities from hydrogen to lead were constant within a factor of 2. The performance of this area detector provides the potential for detection of kiloelectronvolt ion images with current ion microscopy

Micrometer and nanometer-scale parallel patterning of ceramic and organic-inorganic hybrid materials

NARCIS (Netherlands)

ten Elshof, Johan E.; Khan, Sajid; Göbel, Ole

2010-01-01

This review gives an overview of the progress made in recent years in the development of low-cost parallel patterning techniques for ceramic materials, silica, and organic–inorganic silsesquioxane-based hybrids from wet-chemical solutions and suspensions on the micrometer and nanometer-scale. The

Transport of secondary electrons and reactive species in ion tracks

Science.gov (United States)

Surdutovich, Eugene; Solov'yov, Andrey V.

2015-08-01

The transport of reactive species brought about by ions traversing tissue-like medium is analysed analytically. Secondary electrons ejected by ions are capable of ionizing other molecules; the transport of these generations of electrons is studied using the random walk approximation until these electrons remain ballistic. Then, the distribution of solvated electrons produced as a result of interaction of low-energy electrons with water molecules is obtained. The radial distribution of energy loss by ions and secondary electrons to the medium yields the initial radial dose distribution, which can be used as initial conditions for the predicted shock waves. The formation, diffusion, and chemical evolution of hydroxyl radicals in liquid water are studied as well. COST Action Nano-IBCT: Nano-scale Processes Behind Ion-Beam Cancer Therapy.

Mapping Thermal Expansion Coefficients in Freestanding 2D Materials at the Nanometer Scale

Science.gov (United States)

Hu, Xuan; Yasaei, Poya; Jokisaari, Jacob; Öǧüt, Serdar; Salehi-Khojin, Amin; Klie, Robert F.

2018-02-01

Two-dimensional materials, including graphene, transition metal dichalcogenides and their heterostructures, exhibit great potential for a variety of applications, such as transistors, spintronics, and photovoltaics. While the miniaturization offers remarkable improvements in electrical performance, heat dissipation and thermal mismatch can be a problem in designing electronic devices based on two-dimensional materials. Quantifying the thermal expansion coefficient of 2D materials requires temperature measurements at nanometer scale. Here, we introduce a novel nanometer-scale thermometry approach to measure temperature and quantify the thermal expansion coefficients in 2D materials based on scanning transmission electron microscopy combined with electron energy-loss spectroscopy to determine the energy shift of the plasmon resonance peak of 2D materials as a function of sample temperature. By combining these measurements with first-principles modeling, the thermal expansion coefficients (TECs) of single-layer and freestanding graphene and bulk, as well as monolayer MoS2 , MoSe2 , WS2 , or WSe2 , are directly determined and mapped.

Functional nanometer-scale structures

Science.gov (United States)

Chan, Tsz On Mario

Nanometer-scale structures have properties that are fundamentally different from their bulk counterparts. Much research effort has been devoted in the past decades to explore new fabrication techniques, model the physical properties of these structures, and construct functional devices. The ability to manipulate and control the structure of matter at the nanoscale has made many new classes of materials available for the study of fundamental physical processes and potential applications. The interplay between fabrication techniques and physical understanding of the nanostructures and processes has revolutionized the physical and material sciences, providing far superior properties in materials for novel applications that benefit society. This thesis consists of two major aspects of my graduate research in nano-scale materials. In the first part (Chapters 3--6), a comprehensive study on the nanostructures based on electrospinning and thermal treatment is presented. Electrospinning is a well-established method for producing high-aspect-ratio fibrous structures, with fiber diameter ranging from 1 nm--1 microm. A polymeric solution is typically used as a precursor in electrospinning. In our study, the functionality of the nanostructure relies on both the nanostructure and material constituents. Metallic ions containing precursors were added to the polymeric precursor following a sol-gel process to prepare the solution suitable for electrospinning. A typical electrospinning process produces as-spun fibers containing both polymer and metallic salt precursors. Subsequent thermal treatments of the as-spun fibers were carried out in various conditions to produce desired structures. In most cases, polymer in the solution and the as-spun fibers acted as a backbone for the structure formation during the subsequent heat treatment, and were thermally removed in the final stage. Polymers were also designed to react with the metallic ion precursors during heat treatment in some

Nanometer-scale temperature imaging for independent observation of Joule and Peltier effects in phase change memory devices.

Science.gov (United States)

Grosse, Kyle L; Pop, Eric; King, William P

2014-09-01

This paper reports a technique for independent observation of nanometer-scale Joule heating and thermoelectric effects, using atomic force microscopy (AFM) based measurements of nanometer-scale temperature fields. When electrical current flows through nanoscale devices and contacts the temperature distribution is governed by both Joule and thermoelectric effects. When the device is driven by an electrical current that is both periodic and bipolar, the temperature rise due to the Joule effect is at a different harmonic than the temperature rise due to the Peltier effect. An AFM tip scanning over the device can simultaneously measure all of the relevant harmonic responses, such that the Joule effect and the Peltier effect can be independently measured. Here we demonstrate the efficacy of the technique by measuring Joule and Peltier effects in phase change memory devices. By comparing the observed temperature responses of these working devices, we measure the device thermopower, which is in the range of 30 ± 3 to 250 ± 10 μV K(-1). This technique could facilitate improved measurements of thermoelectric phenomena and properties at the nanometer-scale.

Nanometer-scale temperature imaging for independent observation of Joule and Peltier effects in phase change memory devices

Energy Technology Data Exchange (ETDEWEB)

Grosse, Kyle L. [Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States); Pop, Eric [Department of Electrical Engineering, Stanford University, Stanford, California 94305 (United States); King, William P., E-mail: wpk@illinois.edu [Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States); Departments of Electrical and Computer Engineering and Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801 (United States)

2014-09-15

This paper reports a technique for independent observation of nanometer-scale Joule heating and thermoelectric effects, using atomic force microscopy (AFM) based measurements of nanometer-scale temperature fields. When electrical current flows through nanoscale devices and contacts the temperature distribution is governed by both Joule and thermoelectric effects. When the device is driven by an electrical current that is both periodic and bipolar, the temperature rise due to the Joule effect is at a different harmonic than the temperature rise due to the Peltier effect. An AFM tip scanning over the device can simultaneously measure all of the relevant harmonic responses, such that the Joule effect and the Peltier effect can be independently measured. Here we demonstrate the efficacy of the technique by measuring Joule and Peltier effects in phase change memory devices. By comparing the observed temperature responses of these working devices, we measure the device thermopower, which is in the range of 30 ± 3 to 250 ± 10 μV K{sup −1}. This technique could facilitate improved measurements of thermoelectric phenomena and properties at the nanometer-scale.

Nanometer-scale displacement measurement with high resolution using dual cavity Fabry-Pérot interferometer for biomimetic robots.

Science.gov (United States)

Lee, Jin-Hyuk; Kim, Dae-Hyun

2014-10-01

A sensor of a biomimetic robot has to measure very small environmental changes such as, nanometer scale strains or displacements. Fiber optic sensor can be also one of candidates for the biomimetic sensor because the sensor is like thread and the shape of the sensor is similar to muscle fiber. A fiber optic interferometer, which is an optical-based sensor, can measure displacement precisely, so such device has been widely studied for the measurement of displacement on a nanometer-scale. Especially, a Quadrature Phase-Shifted Fiber Fabry-Pérot interferometer (QPS-FFPI) uses phase-information for this measurement, allowing it to provide a precision result with high resolution. In theory, the QPS-FFPI generates two sinusoidal signals of which the phase difference should be 90 degrees for the exact measurement of the displacement. In order to guarantee the condition of the phase difference, the relative adjustment of the cavities of the optical fibers is required. However, with such precise adjustment it is very hard to fix the proper difference of the two cavities for quadrature-phase-shifting. In this paper, a dual-cavity FFPI is newly proposed to measure the displacement on a nanometer-scale with a specific type of signal processing. In the signal processing, a novel phase-compensation algorithm is applied to force the phase difference to be exactly 90 degrees without any physical adjustment. As a result, the paper shows that the phase-compensated dual-cavity FFPI can effectively measure nanometer-scale displacement with high resolution under dynamic conditions.

Bridging the Gap between the Nanometer-Scale Bottom-Up and Micrometer-Scale Top-Down Approaches for Site-Defined InP/InAs Nanowires.

Science.gov (United States)

Zhang, Guoqiang; Rainville, Christophe; Salmon, Adrian; Takiguchi, Masato; Tateno, Kouta; Gotoh, Hideki

2015-11-24

This work presents a method that bridges the gap between the nanometer-scale bottom-up and micrometer-scale top-down approaches for site-defined nanostructures, which has long been a significant challenge for applications that require low-cost and high-throughput manufacturing processes. We realized the bridging by controlling the seed indium nanoparticle position through a self-assembly process. Site-defined InP nanowires were then grown from the indium-nanoparticle array in the vapor-liquid-solid mode through a "seed and grow" process. The nanometer-scale indium particles do not always occupy the same locations within the micrometer-scale open window of an InP exposed substrate due to the scale difference. We developed a technique for aligning the nanometer-scale indium particles on the same side of the micrometer-scale window by structuring the surface of a misoriented InP (111)B substrate. Finally, we demonstrated that the developed method can be used to grow a uniform InP/InAs axial-heterostructure nanowire array. The ability to form a heterostructure nanowire array with this method makes it possible to tune the emission wavelength over a wide range by employing the quantum confinement effect and thus expand the application of this technology to optoelectronic devices. Successfully pairing a controllable bottom-up growth technique with a top-down substrate preparation technique greatly improves the potential for the mass-production and widespread adoption of this technology.

Hybrid approaches to nanometer-scale patterning: Exploiting tailored intermolecular interactions

International Nuclear Information System (INIS)

Mullen, Thomas J.; Srinivasan, Charan; Shuster, Mitchell J.; Horn, Mark W.; Andrews, Anne M.; Weiss, Paul S.

2008-01-01

In this perspective, we explore hybrid approaches to nanometer-scale patterning, where the precision of molecular self-assembly is combined with the sophistication and fidelity of lithography. Two areas - improving existing lithographic techniques through self-assembly and fabricating chemically patterned surfaces - will be discussed in terms of their advantages, limitations, applications, and future outlook. The creation of such chemical patterns enables new capabilities, including the assembly of biospecific surfaces to be recognized by, and to capture analytes from, complex mixtures. Finally, we speculate on the potential impact and upcoming challenges of these hybrid strategies.

Transmission electron microscopical study of teenage crown dentin on the nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Panfilov, Peter, E-mail: peter.panfilov@urfu.ru [Ural Federal University, Ekaterinburg (Russian Federation); Kabanova, Anna [Ural Federal University, Ekaterinburg (Russian Federation); Guo, Jinming; Zhang, Zaoli [Erich Schmid Institute for Materials Science, Austrian Academy of Sciences, Leoben (Austria)

2017-02-01

Statement of significance: This is the first transmission electron microscopic study of teenage crown dentin on the nanometer scale. Samples for TEM were prepared by mechanical thinning and chemical polishing that allowed obtaining the electron transparent foils. It was firstly shown that human dentin possesses the layered morphology: the layers are oriented normally to the main axis of a tooth and have the thickness of ~ 50 nm. HA inorganic phase of teenage crown dentin is in the amorphous state. The cellular structure, which was formed from collagen fibers (diameter is ~ 5 nm), are observed near DEJ region in teenage dentin, whereas bioorganic phase of teenage crown dentin near the pulp camera does not contain the collagen fibers. Cracks in dentin thin foils have sharp tips, but big angles of opening (~ 30{sup °}) with plastic zone ahead crack tip. It means that young crown human dentin exhibits ductile or viscous-elastic fracture behavior on the nanometer scale. - Highlights: • Dentin has layered morphology. • Mineral component of dentin is in amorphous state. • Collagen fibers form cellular structure in dentin. • Cracks in dentin behave by elastic-plastic manner.

Transmission electron microscopical study of teenage crown dentin on the nanometer scale

International Nuclear Information System (INIS)

Panfilov, Peter; Kabanova, Anna; Guo, Jinming; Zhang, Zaoli

2017-01-01

Statement of significance: This is the first transmission electron microscopic study of teenage crown dentin on the nanometer scale. Samples for TEM were prepared by mechanical thinning and chemical polishing that allowed obtaining the electron transparent foils. It was firstly shown that human dentin possesses the layered morphology: the layers are oriented normally to the main axis of a tooth and have the thickness of ~ 50 nm. HA inorganic phase of teenage crown dentin is in the amorphous state. The cellular structure, which was formed from collagen fibers (diameter is ~ 5 nm), are observed near DEJ region in teenage dentin, whereas bioorganic phase of teenage crown dentin near the pulp camera does not contain the collagen fibers. Cracks in dentin thin foils have sharp tips, but big angles of opening (~ 30 ° ) with plastic zone ahead crack tip. It means that young crown human dentin exhibits ductile or viscous-elastic fracture behavior on the nanometer scale. - Highlights: • Dentin has layered morphology. • Mineral component of dentin is in amorphous state. • Collagen fibers form cellular structure in dentin. • Cracks in dentin behave by elastic-plastic manner.

Nanometer Characterization/Manipulation Facility

Data.gov (United States)

Federal Laboratory Consortium — FUNCTION: Characterizes the nanometer scale of biological, chemical, physical, electronic, and mechanical properties of surfaces and thin films using scanning probe...

Helium Ion Microscope: A New Tool for Sub-nanometer Imaging of Soft Materials

Science.gov (United States)

Shutthanandan, V.; Arey, B.; Smallwood, C. R.; Evans, J. E.

2017-12-01

High-resolution inspection of surface details is needed in many biological and environmental researches to understand the Soil organic material (SOM)-mineral interactions along with identifying microbial communities and their interactions. SOM shares many imaging characteristics with biological samples and getting true surface details from these materials are challenging since they consist of low atomic number materials. FE-SEM imaging is the main imagining technique used to image these materials in the past. These SEM images often show loss of resolution and increase noise due to beam damage and charging issues. Newly developed Helium Ion Microscope (HIM), on the other hand can overcome these difficulties and give very fine details. HIM is very similar to scanning electron microscopy (SEM) but instead of using electrons as a probe beam, HIM uses helium ions with energy ranges from 5 to 40 keV. HIM offers a series of advantages compared to SEM such as nanometer and sub-nanometer image resolutions (about 0.35 nm), detailed surface topography, high surface sensitivity, low Z material imaging (especially for polymers and biological samples), high image contrast, and large depth of field. In addition, HIM also has the ability to image insulating materials without any conductive coatings so that surface details are not modified. In this presentation, several scientific applications across biology and geochemistry will be presented to highlight the effectiveness of this powerful microscope. Acknowledgements: Research was performed using the Environmental Molecular Sciences Laboratory (EMSL), a national scientific user facility sponsored by the Department of Energy's Office of Biological and Environmental Research and located at PNNL. Work was supported by DOE-BER Mesoscale to Molecules Bioimaging Project FWP# 66382.

Non-exponential resistive switching in Ag2S memristors: a key to nanometer-scale non-volatile memory devices.

Science.gov (United States)

Gubicza, Agnes; Csontos, Miklós; Halbritter, András; Mihály, György

2015-03-14

The dynamics of resistive switchings in nanometer-scale metallic junctions formed between an inert metallic tip and an Ag film covered by a thin Ag2S layer are investigated. Our thorough experimental analysis and numerical simulations revealed that the resistance change upon a switching bias voltage pulse exhibits a strongly non-exponential behaviour yielding markedly different response times at different bias levels. Our results demonstrate the merits of Ag2S nanojunctions as nanometer-scale non-volatile memory cells with stable switching ratios, high endurance as well as fast response to write/erase, and an outstanding stability against read operations at technologically optimal bias and current levels.

Analysis of nano-meter structure in Ti implanted polymers

International Nuclear Information System (INIS)

Zhou Gu; Wu Yuguang; Zhang Tonghe; Zhao Xinrong

2001-01-01

Polyethylene terephthalate (PET) is modified with Ti ion implantation to a dose of 1x10 17 to 2 x 10 17 cm -2 by using a metal vapor vacuum arc(MEVVA)source. Nano-meter structures in the implanted sample are observed by means of transmission electron microscope (TEM). The influence of ion dose on the structure is indicated. The results show that dense nano-meter phases are dispersed uniformly in the implanted layer. TEM cross section indicates that there is a three-layer structure in the implanted PET. It is found that a metallurgical surface is formed. Therefore the hardness, wear resistance and conductive properties of PET are improved after metal ion implantation. The mechanism of electrical conduction will be discussed

Nanometer-Scale Pore Characteristics of Lacustrine Shale, Songliao Basin, NE China.

Directory of Open Access Journals (Sweden)

Min Wang

Full Text Available In shale, liquid hydrocarbons are accumulated mainly in nanometer-scale pores or fractures, so the pore types and PSDs (pore size distributions play a major role in the shale oil occurrence (free or absorbed state, amount of oil, and flow features. The pore types and PSDs of marine shale have been well studied; however, research on lacustrine shale is rare, especially for shale in the oil generation window, although lacustrine shale is deposited widely around the world. To investigate the relationship between nanometer-scale pores and oil occurrence in the lacustrine shale, 10 lacustrine shale core samples from Songliao Basin, NE China were analyzed. Analyses of these samples included geochemical measurements, SEM (scanning electron microscope observations, low pressure CO2 and N2 adsorption, and high-pressure mercury injection experiments. Analysis results indicate that: (1 Pore types in the lacustrine shale include inter-matrix pores, intergranular pores, organic matter pores, and dissolution pores, and these pores are dominated by mesopores and micropores; (2 There is no apparent correlation between pore volumes and clay content, however, a weak negative correlation is present between total pore volume and carbonate content; (3 Pores in lacustrine shale are well developed when the organic matter maturity (Ro is >1.0% and the pore volume is positively correlated with the TOC (total organic carbon content. The statistical results suggest that oil in lacustrine shale mainly occurs in pores with diameters larger than 40 nm. However, more research is needed to determine whether this minimum pore diameter for oil occurrence in lacustrine shale is widely applicable.

Nanometer scale thermometry in a living cell

Science.gov (United States)

Kucsko, G.; Maurer, P. C.; Yao, N. Y.; Kubo, M.; Noh, H. J.; Lo, P. K.; Park, H.; Lukin, M. D.

2014-01-01

Sensitive probing of temperature variations on nanometer scales represents an outstanding challenge in many areas of modern science and technology1. In particular, a thermometer capable of sub-degree temperature resolution over a large range of temperatures as well as integration within a living system could provide a powerful new tool for many areas of biological, physical and chemical research; possibilities range from the temperature-induced control of gene expression2–5 and tumor metabolism6 to the cell-selective treatment of disease7,8 and the study of heat dissipation in integrated circuits1. By combining local light-induced heat sources with sensitive nanoscale thermometry, it may also be possible to engineer biological processes at the sub-cellular level2–5. Here, we demonstrate a new approach to nanoscale thermometry that utilizes coherent manipulation of the electronic spin associated with nitrogen-vacancy (NV) color centers in diamond. We show the ability to detect temperature variations down to 1.8 mK (sensitivity of 9mK/Hz) in an ultra-pure bulk diamond sample. Using NV centers in diamond nanocrystals (nanodiamonds, NDs), we directly measure the local thermal environment at length scales down to 200 nm. Finally, by introducing both nanodiamonds and gold nanoparticles into a single human embryonic fibroblast, we demonstrate temperature-gradient control and mapping at the sub-cellular level, enabling unique potential applications in life sciences. PMID:23903748

Comparison of secondary ion emission yields for poly-tyrosine between cluster and heavy ion impacts

International Nuclear Information System (INIS)

Hirata, K.; Saitoh, Y.; Chiba, A.; Yamada, K.; Takahashi, Y.; Narumi, K.

2010-01-01

Emission yields of secondary ions necessary for the identification of poly-tyrosine were compared for incident ion impacts of energetic cluster ions (0.8 MeV C 8 + , 2.4 MeV C 8 + , and 4.0 MeV C 8 + ) and swift heavy monoatomic molybdenum ions (4.0 MeV Mo + and 14 MeV Mo 4+ ) with similar mass to that of the cluster by time-of-flight secondary ion mass analysis combined with secondary ion electric current measurements. The comparison revealed that (1) secondary ion emission yields per C 8 + impact increase with increasing incident energy within the energy range examined, (2) the 4.0 MeV C 8 + impact provides higher emission yields than the impact of the monoatomic Mo ion with the same incident energy (4.0 MeV Mo + ), and (3) the 2.4 MeV C 8 + impact exhibits comparable emission yields to that for the Mo ion impact with higher incident energy (14 MeV Mo 4+ ). Energetic cluster ion impacts effectively produce the characteristic secondary ions for poly-tyrosine, which is advantageous for highly sensitive amino acid detection in proteins using time-of-flight secondary ion mass analysis.

Energy dependent track structure parametrizations for protons and carbon ions based on nano-metric simulations

International Nuclear Information System (INIS)

Frauke, A.; Wilkens, J.J.; Villagrasa, C.; Rabus, H.

2015-01-01

The BioQuaRT project within the European Metrology Research Programme aims at correlating ion track structure characteristics with the biological effects of radiation and develops measurement and simulation techniques for determining ion track structure on different length scales from about 2 nm to about 10 μm. Within this framework, we investigate methods to translate track-structure quantities derived on a nanometer scale to macroscopic dimensions. Input data sets were generated by simulations of ion tracks of protons and carbon ions in liquid water using the Geant-4 Monte Carlo tool-kit with the Geant-4-DNA processes. Based on the energy transfer points - recorded with nanometer resolution - we investigated parametrizations of overall properties of ion track structure. Three different track structure parametrizations have been developed using the distances to the 10 next neighbouring ionizations, the radial energy distribution and ionisation cluster size distributions. These parametrizations of nanometer-scale track structure build a basis for deriving biologically relevant mean values which are essential in the clinical situation where each voxel is exposed to a mixed radiation field. (authors)

Sub-micrometer-scale patterning on Zr-based metallic glass using focused ion beam irradiation and chemical etching

Energy Technology Data Exchange (ETDEWEB)

Kawasegi, Noritaka [Graduate School of Science and Engineering, University of Toyama, 3190 Gofuku, Toyama 930-8555 (Japan); Morita, Noboru [Graduate School of Science and Engineering for Research, University of Toyama, 3190 Gofuku, Toyama 930-8555 (Japan); Yamada, Shigeru [Graduate School of Science and Engineering for Research, University of Toyama, 3190 Gofuku, Toyama 930-8555 (Japan); Takano, Noboru [Graduate School of Science and Engineering for Research, University of Toyama, 3190 Gofuku, Toyama 930-8555 (Japan); Oyama, Tatsuo [Department of Mechanical and Intellectual Systems Engineering, University of Toyama, 3190 Gofuku, Toyama 930-8555 (Japan); Ashida, Kiwamu [Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology, 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564 (Japan); Momota, Sadao [Department of Intelligent Mechanical Systems Engineering, Kochi University of Technology, 185 Tosayamada, Kochi 782-8502 (Japan); Taniguchi, Jun [Department of Applied Electronics, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510 (Japan); Miyamoto, Iwao [Department of Applied Electronics, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510 (Japan); Ofune, Hitoshi [YKK Corporation, 200 Yoshida, Kurobe, Toyama 938-8601 (Japan)

2007-09-19

This report describes a method of sub-micrometer-scale rapid patterning on a Zr-based metallic glass surface using a combination of focused ion beam irradiation and wet chemical etching. We found that a Zr-based metallic glass surface irradiated with Ga{sup +} ions could be selectively etched; a concave structure with a width and depth of several tens to hundreds of nanometers rapidly formed in the irradiated area. Moreover, we determined that the etching was enhanced by the presence of Ga{sup +} ions rather than a change in the crystal structure, and the structure could be fabricated while the substrate remained amorphous. The shape of the structure was principally a function of the dose and the etch time.

Self-assembled metallic nanoparticle template — a new approach of surface nanostructuring at nanometer scale

Directory of Open Access Journals (Sweden)

A. Taleb

2017-09-01

Full Text Available In the present work, the formation of silver and copper nanostructures on highly oriented pyrolytic graphite (HOPG modified with self-assembled gold nanoparticles (Au NPs is demonstrated. Surface patterning with nanometer resolution was achieved. Different methods such as field emission scanning electron microscopy (FEGSEM, energy dispersive spectrometry (EDS and X-ray photoelectron spectroscopy (XPS were used to illustrate a selective deposition of silver and copper on Au NPs. The mechanism of silver and copper ions reduction on Au NP with n-dodecanethiol coating is discussed.

Comparison between XAS, AWAXS and DAFS applied to nanometer scale supported metallic clusters. Pt.1; monometallic clusters

International Nuclear Information System (INIS)

Bazin, D.C.; Sayers, D.A.

1993-01-01

The structural information found using three techniques related to synchrotron radiation are compared. XAS (X-ray Absorption Spectroscopy), AWAXS (Anomalous Wide Angle X-ray Scattering) and DAFS (Diffraction Anomalous Fine Structure) are applied to nanometer scale metallic clusters. (author)

Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes

International Nuclear Information System (INIS)

Attota, Ravikiran; Dixson, Ronald G.

2014-01-01

We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 4-D optical data using the through-focus scanning optical microscopy (TSOM) method. These initial results show that TSOM-determined cross-sectional (3-D) shape differences of 30 nm–40 nm wide lines agree well with critical-dimension atomic force microscope measurements. The TSOM method showed a linewidth uncertainty of 1.22 nm (k = 2). Complex optical simulations are not needed for analysis using the TSOM method, making the process simple, economical, fast, and ideally suited for high volume nanomanufacturing process monitoring.

Comparison between XAS, AWAXS and DAFS applied to nanometer scale supported metallic clusters. Pt.2; bimetallic clusters

International Nuclear Information System (INIS)

Bazin, D.; Sayers, D.

1993-01-01

The structural information obtained using three techniques related to synchrotron radiation are compared. XAS (X-ray Absorption Spectroscopy), AWAXS (Anomalous Wide Angle X-ray Scattering) and DAFS (Diffraction Anomalous Fine Structure) are applied to the study of nanometer scale bimetallic clusters. (author)

Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

Science.gov (United States)

Thompson, William; Stern, Lewis; Ferranti, Dave; Huynh, Chuong; Scipioni, Larry; Notte, John; Sanford, Colin

2010-06-01

Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical and chemical properties and to its surface topography. This SE yield sensitivity is due to the low recoil energy of the HIM initiated electrons and their resulting short mean free path. Additionally, a material's SE escape probability is modulated by changes in the material's work function and surface potential. Due to the escape electrons' roughly 2eV mean energy and their nanometer range mean free path, HIM SE mode image contrast has significant material and surface sensitivity. The latest generation of HIM has a 0.35 nanometer resolution specification and is equipped with a plasma cleaning process to mitigate the effects of hydrocarbon contamination. However, for surfaces that may have native oxide chemistries influencing the secondary electron yield, a new process of low energy, shallow angle argon sputtering, was evaluated. The intent of this work was to study the effect of removing pre-existing native oxides and any in-situ deposited surface contaminants. We will introduce the sputter yield predictions of two established computer models and the sputter yield and sample modification forecasts of the molecular dynamics program, Kalypso. We will review the experimental technique applied to copper samples and show the copper grain contrast improvement that resulted when argon cleaned samples were imaged in HIM SE mode.

Fundamental properties of secondary negative ion emission by sputtering

International Nuclear Information System (INIS)

Shimizu, Toshiki; Tsuji, Hiroshi; Ishikawa, Junzo

1989-01-01

The report describes some results obtained from preliminary experiments on secondary negative ion emission from a cesiated surface by Xe-ion beam sputtering, which give the production probability. A measuring system is constructed for secondary negative ion emission. The system consists of a microwave ion source with a lens, a sputtering target holder with a heater, a cesium oven, a limiting aperture with a substrate for deposition, a negative-ion extractor and lens, and a ExB type mass separator. Observations are made on the dependence of negative ion current on cesium supply, dependence of negative ion current on target temperature, and negative ion production probability. The cesium supply and the target temperature are found to strongly influence the negative ion emission. By controlling these factors, the optimum condition for secondary negative ion emission is achieved with a minimum surface work function. The production probability of the negative ion is found to be very high, about 20% for carbon. Therefore, the secondary negative ion emission is considered a useful and highly efficient method to obtain high current ion beams. The constant in the Rasser's theoretical equation is experimentally determined to be 4.1 x 10 -4 eV sec/m. (N.K.)

Angular dependence of secondary ion emission from silicon bombarded with inert gas ions

International Nuclear Information System (INIS)

Wittmaack, K.

1984-01-01

The emission of positive and negative, atomic and molecular secondary ions sputtered from silicon has been studied under ultrahigh vacuum conditions. The sample was bombarded with 2-12 keV Ar + and Xe + ions at angles of incidence between 0 0 and 60 0 to the surface normal. The angular dependence of the secondary ion intensity as well as the energy spectra of Si + and Si - were found to differ significantly. The effect is attributed mostly do differences in the rate of neutralization. The stability of molecular ions appears to be independent of the charge state. Supporting evidence is provided for the idea that multiply charged secondary ions are due to Auger de-excitation of sputtered atoms in vacuum. (orig.)

Nanometer size field effect transistors for terahertz detectors

International Nuclear Information System (INIS)

Knap, W; Rumyantsev, S; Coquillat, D; Dyakonova, N; Teppe, F; Vitiello, M S; Tredicucci, A; Blin, S; Shur, M; Nagatsuma, T

2013-01-01

Nanometer size field effect transistors can operate as efficient resonant or broadband terahertz detectors, mixers, phase shifters and frequency multipliers at frequencies far beyond their fundamental cut-off frequency. This work is an overview of some recent results concerning the application of nanometer scale field effect transistors for the detection of terahertz radiation. (paper)

Nanopore Measurements of Filamentous Viruses Reveal a Sub-nanometer-Scale Stagnant Fluid Layer.

Science.gov (United States)

McMullen, Angus J; Tang, Jay X; Stein, Derek

2017-11-28

We report measurements and analyses of nanopore translocations by fd and M13, two related strains of filamentous virus that are identical except for their charge densities. The standard continuum theory of electrokinetics greatly overestimates the translocation speed and the conductance associated with counterions for both viruses. Furthermore, fd and M13 behave differently from one another, even translocating in opposite directions under certain conditions. This cannot be explained by Manning-condensed counterions or a number of other proposed models. Instead, we argue that these anomalous findings are consequences of the breakdown of the validity of continuum hydrodynamics at the scale of a few molecular layers. Next to a polyelectrolyte, there exists an extra-viscous, sub-nanometer-thin boundary layer that has a giant influence on the transport characteristics. We show that a stagnant boundary layer captures the essential hydrodynamics and extends the validity of the electrokinetic theory beyond the continuum limit. A stagnant layer with a thickness of about half a nanometer consistently improves predictions of the ionic current change induced by virus translocations and of the translocation velocity for both fd and M13 over a wide range of nanopore dimensions and salt concentrations.

Backscattered Helium Spectroscopy in the Helium Ion Microscope: Principles, Resolution and Applications

NARCIS (Netherlands)

van Gastel, Raoul; Hlawacek, G.; Dutta, S.; Poelsema, Bene

2015-01-01

We demonstrate the possibilities and limitations for microstructure characterization using backscattered particles from a sharply focused helium ion beam. The interaction of helium ions with matter enables the imaging, spectroscopic characterization, as well as the nanometer scale modification of

2D surface optical lattice formed by plasmon polaritons with application to nanometer-scale molecular deposition.

Science.gov (United States)

Yin, Yanning; Xu, Supeng; Li, Tao; Yin, Yaling; Xia, Yong; Yin, Jianping

2017-08-10

Surface plasmon polaritons, due to their tight spatial confinement and high local intensity, hold great promises in nanofabrication which is beyond the diffraction limit of conventional lithography. Here, we demonstrate theoretically the 2D surface optical lattices based on the surface plasmon polariton interference field, and the potential application to nanometer-scale molecular deposition. We present the different topologies of lattices generated by simple configurations on the substrate. By explicit theoretical derivations, we explain their formation and characteristics including field distribution, periodicity and phase dependence. We conclude that the topologies can not only possess a high stability, but also be dynamically manipulated via changing the polarization of the excitation laser. Nanometer-scale molecular deposition is simulated with these 2D lattices and discussed for improving the deposition resolution. The periodic lattice point with a width resolution of 33.2 nm can be obtained when the fullerene molecular beam is well-collimated. Our study can offer a superior alternative method to fabricate the spatially complicated 2D nanostructures, with the deposition array pitch serving as a reference standard for accurate and traceable metrology of the SI length standard.

Tracing temperature in a nanometer size region in a picosecond time period.

Science.gov (United States)

Nakajima, Kaoru; Kitayama, Takumi; Hayashi, Hiroaki; Matsuda, Makoto; Sataka, Masao; Tsujimoto, Masahiko; Toulemonde, Marcel; Bouffard, Serge; Kimura, Kenji

2015-08-21

Irradiation of materials with either swift heavy ions or slow highly charged ions leads to ultrafast heating on a timescale of several picosecond in a region of several nanometer. This ultrafast local heating result in formation of nanostructures, which provide a number of potential applications in nanotechnologies. These nanostructures are believed to be formed when the local temperature rises beyond the melting or boiling point of the material. Conventional techniques, however, are not applicable to measure temperature in such a localized region in a short time period. Here, we propose a novel method for tracing temperature in a nanometer region in a picosecond time period by utilizing desorption of gold nanoparticles around the ion impact position. The feasibility is examined by comparing with the temperature evolution predicted by a theoretical model.

Carbon nanotube transistors scaled to a 40-nanometer footprint.

Science.gov (United States)

Cao, Qing; Tersoff, Jerry; Farmer, Damon B; Zhu, Yu; Han, Shu-Jen

2017-06-30

The International Technology Roadmap for Semiconductors challenges the device research community to reduce the transistor footprint containing all components to 40 nanometers within the next decade. We report on a p-channel transistor scaled to such an extremely small dimension. Built on one semiconducting carbon nanotube, it occupies less than half the space of leading silicon technologies, while delivering a significantly higher pitch-normalized current density-above 0.9 milliampere per micrometer at a low supply voltage of 0.5 volts with a subthreshold swing of 85 millivolts per decade. Furthermore, we show transistors with the same small footprint built on actual high-density arrays of such nanotubes that deliver higher current than that of the best-competing silicon devices under the same overdrive, without any normalization. We achieve this using low-resistance end-bonded contacts, a high-purity semiconducting carbon nanotube source, and self-assembly to pack nanotubes into full surface-coverage aligned arrays. Copyright © 2017 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works.

Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging.

Science.gov (United States)

Kiss, András; Smith, Donald F; Jungmann, Julia H; Heeren, Ron M A

2013-12-30

Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces. Technological developments such as new position-sensitive detectors, in combination with polyatomic primary ion sources, are required to exploit the full potential of microscope mode mass spectrometry imaging, i.e. to efficiently push the limits of ultra-high spatial resolution, sample throughput and sensitivity. In this work, a C60 primary source was combined with a commercial mass microscope for microscope mode secondary ion mass spectrometry imaging. The detector setup is a pixelated detector from the Medipix/Timepix family with high-voltage post-acceleration capabilities. The system's mass spectral and imaging performance is tested with various benchmark samples and thin tissue sections. The high secondary ion yield (with respect to 'traditional' monatomic primary ion sources) of the C60 primary ion source and the increased sensitivity of the high voltage detector setup improve microscope mode secondary ion mass spectrometry imaging. The analysis time and the signal-to-noise ratio are improved compared with other microscope mode imaging systems, all at high spatial resolution. We have demonstrated the unique capabilities of a C60 ion microscope with a Timepix detector for high spatial resolution microscope mode secondary ion mass spectrometry imaging. Copyright © 2013 John Wiley & Sons, Ltd.

Mass spectrum of secondary ions knocked-out from copper surface by argon ion beam

International Nuclear Information System (INIS)

Koval', A.G.; Bobkov, V.V.; Klimovskij, Yu.A.; Fogel', Ya.M.

1976-01-01

The mass-spectrum of secondary ions was studied within a mass range of 1-400. The ions were knocked-out by the beam of ions Ar + from the copper surface with different content of oxygen and sulphur solved in the volume. The studies were conducted at three temperatures of the target. The atomic and molecular ions of the metal matrix, volumetric impurities of metal and ions of chemical compounds molecules of the metal under study with gas particles adsorbed on its surface and atoms of the metal volumetric admixtures may be observed in the mass spectrum. Detection of secondary ions of the copper multi-atomic complexes and ions of these complexes compounds with the adsorbed molecules is of interest

High mass accuracy and high mass resolving power FT-ICR secondary ion mass spectrometry for biological tissue imaging

NARCIS (Netherlands)

Smith, D.F.; Kiss, A.; Leach, F.E.; Robinson, E.W.; Paša-Tolić, L.; Heeren, R.M.A.

2013-01-01

Biological tissue imaging by secondary ion mass spectrometry has seen rapid development with the commercial availability of polyatomic primary ion sources. Endogenous lipids and other small bio-molecules can now be routinely mapped on the sub-micrometer scale. Such experiments are typically

Monte Carlo simulations of secondary electron emission due to ion beam milling

Energy Technology Data Exchange (ETDEWEB)

Mahady, Kyle [Univ. of Tennessee, Knoxville, TN (United States); Tan, Shida [Intel Corp., Santa Clara, CA (United States); Greenzweig, Yuval [Intel Israel Ltd., Haifa (Israel); Livengood, Richard [Intel Corp., Santa Clara, CA (United States); Raveh, Amir [Intel Israel Ltd., Haifa (Israel); Fowlkes, Jason D. [Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Rack, Philip [Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

2017-07-01

We present a Monte Carlo simulation study of secondary electron emission resulting from focused ion beam milling of a copper target. The basis of this study is a simulation code which simulates ion induced excitation and emission of secondary electrons, in addition to simulating focused ion beam sputtering and milling. This combination of features permits the simulation of the interaction between secondary electron emission, and the evolving target geometry as the ion beam sputters material. Previous ion induced SE Monte Carlo simulation methods have been restricted to predefined target geometries, while the dynamic target in the presented simulations makes this study relevant to image formation in ion microscopy, and chemically assisted ion beam etching, where the relationship between sputtering, and its effects on secondary electron emission, is important. We focus on a copper target, and validate our simulation against experimental data for a range of: noble gas ions, ion energies, ion/substrate angles and the energy distribution of the secondary electrons. We then provide a detailed account of the emission of secondary electrons resulting from ion beam milling; we quantify both the evolution of the yield as high aspect ratio valleys are milled, as well as the emission of electrons within these valleys that do not escape the target, but which are important to the secondary electron contribution to chemically assisted ion induced etching.

Study of thin insulating films using secondary ion emission

International Nuclear Information System (INIS)

Hilleret, Noel

1973-01-01

Secondary ion emission from insulating films was investigated using a CASTAING-SLODZIAN ion analyzer. Various different aspects of the problem were studied: charge flow across a silica film; the mobilization of sodium during ion bombardment; consequences of the introduction of oxygen on the emission of secondary ions from some solids; determination of the various characteristics of secondary ion emission from silica, silicon nitride and silicon. An example of measurements made using this type of operation is presented: profiles (concentration as a function of depth) of boron introduced by diffusion or implantation in thin films of silica on silicon or silicon nitride. Such measurements have applications in microelectronics. The same method of operation was extended to other types of insulating film, and in particular, to the metallurgical study of passivation films formed on the surface of stainless steels. (author) [fr

SU-D-BRB-02: Investigations of Secondary Ion Distributions in Carbon Ion Therapy Using the Timepix Detector.

Science.gov (United States)

Gwosch, K; Hartmann, B; Jakubek, J; Granja, C; Soukup, P; Jaekel, O; Martisikova, M

2012-06-01

Due to the high conformity of carbon ion therapy, unpredictable changes in the patient's geometry or deviations from the planned beam properties can result in changes of the dose distribution. PET has been used successfully to monitor the actual dose distribution in the patient. However, it suffers from biological washout processes and low detection efficiency. The purpose of this contribution is to investigate the potential of beam monitoring by detection of prompt secondary ions emerging from a homogeneous phantom, simulating a patient's head. Measurements were performed at the Heidelberg Ion-Beam Therapy Center (Germany) using a carbon ion pencil beam irradiated on a cylindrical PMMA phantom (16cm diameter). For registration of the secondary ions, the Timepix detector was used. This pixelated silicon detector allows position-resolved measurements of individual ions (256×256 pixels, 55μm pitch). To track the secondary ions we used several parallel detectors (3D voxel detector). For monitoring of the beam in the phantom, we analyzed the directional distribution of the registered ions. This distribution shows a clear dependence on the initial beam energy, width and position. Detectable were range differences of 1.7mm, as well as vertical and horizontal shifts of the beam position by 1mm. To estimate the clinical potential of this method, we measured the yield of secondary ions emerging from the phantom for a beam energy of 226MeV/u. The differential distribution of secondary ions as a function of the angle from the beam axis for angles between 0 and 90° will be presented. In this setup the total yield in the forward hemisphere was found to be in the order of 10 -1 secondary ions per primary carbon ion. The presented measurements show that tracking of secondary ions provides a promising method for non-invasive monitoring of ion beam parameters for clinical relevant carbon ion fluences. Research with the pixel detectors was carried out in frame of the Medipix

Pseudopotential-based electron quantum transport: Theoretical formulation and application to nanometer-scale silicon nanowire transistors

Energy Technology Data Exchange (ETDEWEB)

Fang, Jingtian, E-mail: jingtian.fang@utdallas.edu; Vandenberghe, William G.; Fu, Bo; Fischetti, Massimo V. [Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080 (United States)

2016-01-21

We present a formalism to treat quantum electronic transport at the nanometer scale based on empirical pseudopotentials. This formalism offers explicit atomistic wavefunctions and an accurate band structure, enabling a detailed study of the characteristics of devices with a nanometer-scale channel and body. Assuming externally applied potentials that change slowly along the electron-transport direction, we invoke the envelope-wavefunction approximation to apply the open boundary conditions and to develop the transport equations. We construct the full-band open boundary conditions (self-energies of device contacts) from the complex band structure of the contacts. We solve the transport equations and present the expressions required to calculate the device characteristics, such as device current and charge density. We apply this formalism to study ballistic transport in a gate-all-around (GAA) silicon nanowire field-effect transistor with a body-size of 0.39 nm, a gate length of 6.52 nm, and an effective oxide thickness of 0.43 nm. Simulation results show that this device exhibits a subthreshold slope (SS) of ∼66 mV/decade and a drain-induced barrier-lowering of ∼2.5 mV/V. Our theoretical calculations predict that low-dimensionality channels in a 3D GAA architecture are able to meet the performance requirements of future devices in terms of SS swing and electrostatic control.

Secondary ion mass spectroscopy (SIMS)

International Nuclear Information System (INIS)

Naik, P.K.

1975-01-01

Secondary Ion Mass Spectrometry (SIMS) which is primarily a method for investigating the chemical composition of the uppermost atomic layer of solid surfaces is explained. In this method, the specimen is bombarded with a primary positive ion beam of small current density monolayer. Positive and negative ions sputtered from the specimen are mass analysed to give the surface chemical composition. The analytical system which consists of a primary ion source, a target manipulator and a mass spectrometer housed in an ultrahigh vacuum system is described. This method can also be used for profile measurements in thin films by using higher current densities of the primary ions. Fields of application such as surface reactions, semiconductors, thin films emission processes, chemistry, metallurgy are touched upon. Various aspects of this method such as the sputtering process, instrumentation, and applications are discussed. (K.B.)

Experiments on secondary ion emission with multicharged keV ion bombardement

International Nuclear Information System (INIS)

Della Negra, S.; Depauw, J.; Joret, H.; Le Beyec, Y.; Schweikert, E.A.

1987-01-01

An electron cyclotron resonance ion source was used to study the influence of the incident charge state of keV ions on secondary ion emission. The experiments were run with 18 keV Arn+ (1 < n < 11) beams produced by a minimafios source. Various types of targets were bombarded by the ion beam and the sputtered ionized species were identified by time of flight mass spectrometry. The experimental arrangement is detailed and preliminary results are indicated

KNO type scaling of secondary charged particles produced in 4.5 a GeV 12C-nucleus collisions

International Nuclear Information System (INIS)

Khushnood, H.; Singh, Prithipal; Shukla, Praveen Prakash; Saleem Khan, M.

2011-01-01

Study of the secondary charged particles produced in heavy ion collisions is attracting a great deal of attention during the recent years. It is reported that the multiplicity distribution of secondary charged particles produced in high energy hadron-hadron and hadron-nucleus collisions Obey Koba, Nielson and Olesen (KNO) scaling. However, no attention has been paid to study the nature of the multiplicity distribution of secondary charged particles produced in relativistic heavy ions reactions. Thus, an attempt has been made to study the multiplicity distribution of secondary charged particles produced in 4.5 A GeV 12 C-nucleus interactions

Size-dependent elastic/inelastic behavior of enamel over millimeter and nanometer length scales.

Science.gov (United States)

Ang, Siang Fung; Bortel, Emely L; Swain, Michael V; Klocke, Arndt; Schneider, Gerold A

2010-03-01

The microstructure of enamel like most biological tissues has a hierarchical structure which determines their mechanical behavior. However, current studies of the mechanical behavior of enamel lack a systematic investigation of these hierarchical length scales. In this study, we performed macroscopic uni-axial compression tests and the spherical indentation with different indenter radii to probe enamel's elastic/inelastic transition over four hierarchical length scales, namely: 'bulk enamel' (mm), 'multiple-rod' (10's microm), 'intra-rod' (100's nm with multiple crystallites) and finally 'single-crystallite' (10's nm with an area of approximately one hydroxyapatite crystallite). The enamel's elastic/inelastic transitions were observed at 0.4-17 GPa depending on the length scale and were compared with the values of synthetic hydroxyapatite crystallites. The elastic limit of a material is important as it provides insights into the deformability of the material before fracture. At the smallest investigated length scale (contact radius approximately 20 nm), elastic limit is followed by plastic deformation. At the largest investigated length scale (contact size approximately 2 mm), only elastic then micro-crack induced response was observed. A map of elastic/inelastic regions of enamel from millimeter to nanometer length scale is presented. Possible underlying mechanisms are also discussed. (c) 2009 Elsevier Ltd. All rights reserved.

Plasma ion sources and ion beam technology in microfabrications

International Nuclear Information System (INIS)

Ji, Lili

2007-01-01

For over decades, focused ion beam (FIB) has been playing a very important role in microscale technology and research, among which, semiconductor microfabrication is one of its biggest application area. As the dimensions of IC devices are scaled down, it has shown the need for new ion beam tools and new approaches to the fabrication of small-scale devices. In the meanwhile, nanotechnology has also deeply involved in material science research and bioresearch in recent years. The conventional FIB systems which utilize liquid gallium ion sources to achieve nanometer scale resolution can no longer meet the various requirements raised from such a wide application area such as low contamination, high throughput and so on. The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. In this thesis, three novel ion beam tools have been developed and investigated as the alternatives for the conventional FIB systems in some particular applications. An integrated focused ion beam (FIB) and scanning electron microscope (SEM) system has been developed for direct doping or surface modification. This new instrument employs a mini-RF driven plasma source to generate focused ion beam with various ion species, a FEI two-lens electron (2LE) column for SEM imaging, and a five-axis manipulator system for sample positioning. An all-electrostatic two-lens column has been designed to focus the ion beam extracted from the source. Based on the Munro ion optics simulation, beam spot sizes as small as 100 nm can be achieved at beam energies between 5 to 35 keV if a 5 (micro)m-diameter extraction aperture is used. Smaller beam spot sizes can be obtained with smaller apertures at sacrifice of some beam current. The FEI 2LE column, which utilizes Schottky emission, electrostatic focusing optics, and stacked-disk column construction, can provide high-resolution (as small as 20 nm) imaging capability, with fairly long working distance

Invention of Lithium Ion Secondary Battery and Its Business Development

OpenAIRE

正本, 順三/米田,晴幸; 米田, 晴幸; MASAMOTO, Junzo; YONEDA, Haruyuki

2010-01-01

At present, mobile phones and laptop computers are essential items in our daily life. As a battery for such portable devices, the lithium ion secondary battery is used. The lithium ion secondary battery, which is used as a battery for such portable devices, was first invented by Dr. Yoshino at Asahi Kasei. In this paper, the authors describe how the lithium ion secondary battery was developed by the inventor. The authors also describe the battery separator, which is one of the key components ...

Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution

Science.gov (United States)

Joens, Matthew S.; Huynh, Chuong; Kasuboski, James M.; Ferranti, David; Sigal, Yury J.; Zeitvogel, Fabian; Obst, Martin; Burkhardt, Claus J.; Curran, Kevin P.; Chalasani, Sreekanth H.; Stern, Lewis A.; Goetze, Bernhard; Fitzpatrick, James A. J.

2013-12-01

Scanning Electron Microscopy (SEM) has long been the standard in imaging the sub-micrometer surface ultrastructure of both hard and soft materials. In the case of biological samples, it has provided great insights into their physical architecture. However, three of the fundamental challenges in the SEM imaging of soft materials are that of limited imaging resolution at high magnification, charging caused by the insulating properties of most biological samples and the loss of subtle surface features by heavy metal coating. These challenges have recently been overcome with the development of the Helium Ion Microscope (HIM), which boasts advances in charge reduction, minimized sample damage, high surface contrast without the need for metal coating, increased depth of field, and 5 angstrom imaging resolution. We demonstrate the advantages of HIM for imaging biological surfaces as well as compare and contrast the effects of sample preparation techniques and their consequences on sub-nanometer ultrastructure.

Nanometer CMOS ICs from basics to ASICs

CERN Document Server

J M Veendrick, Harry

2017-01-01

This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.

Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

DEFF Research Database (Denmark)

Bogdanović Radović, Iva; Siketić, Zdravko; Jembrih-Simbürger, Dubravka

2017-01-01

Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identi......Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could...... be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for Me......V Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples...

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector.

NARCIS (Netherlands)

Kiss, A.; Jungmann, JH; Smith, D.F.; Heeren, R.M.A.

2013-01-01

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS)

X-ray diffraction and high resolution transmission electron microscopy characterization of intermetallics formed in Fe/Ti nanometer-scale multilayers during thermal annealing

International Nuclear Information System (INIS)

Wu, Z.L.; Peng, T.X.; Cao, B.S.; Lei, M.K.

2009-01-01

Intermetallics formation in the Fe/Ti nanometer-scale multilayers magnetron-sputtering deposited on Si(100) substrate during thermal annealing at 623-873 K was investigated by using small and wide angle X-ray diffraction and cross-sectional high-resolution transmission electron microscopy. The Fe/Ti nanometer-scale multilayers were constructed with bilayer thickness of 16.2 nm and the sublayer thickness ratio of 1:1. At the annealing temperature of 623 K, intermetallics FeTi were formed by nucleation at the triple joins of α-Fe(Ti)/α-Ti interface and α-Ti grain boundary with an orientational correlation of FeTi(110)//α-Ti(100) and FeTi[001]//α-Ti[001] to adjacent α-Ti grains. The lateral growth of intermetallics FeTi which is dependent on the diffusion path of Ti led to a coalescence into an intermetallic layer. With an increase in the annealing temperature, intermetallics Fe 2 Ti were formed between the intermetallics FeTi and the excess Fe due to the limitation of Fe and Ti atomic concentrations, resulting in the coexistence of intermetallics FeTi and Fe 2 Ti. It was found that the low energy interface as well as the dominant diffusion path constrained the nucleation and growth of intermetallics during interfacial reaction in the nanometer-scale metallic multilayers.

Electronic excitation effects on secondary ion emission in highly charged ion-solid interaction

International Nuclear Information System (INIS)

Sekioka, T.; Terasawa, M.; Mitamura, T.; Stoeckli, M.P.; Lehnert, U.; Fehrenbach, C.

2001-01-01

In order to investigate the secondary ion emission from the surface of conductive materials bombarded by highly charged heavy ions, we have done two types of experiments. First, we have measured the yield of the sputtered ions from the surface of solid targets of conductive materials (Al, Si, Ni, Cu) bombarded by Xe q+ (q=15-44) at 300 keV (v p =0.30 a.u) and at 1.0 MeV (v p =0.54 a.u). In view of the secondary ion yields as a function of the potential energy of the projectile, the increase rates below q=35, where the potential energy amounts to 25.5 keV, were rather moderate and showed a prominent increase above q=35. These phenomena were rather strong in the case of the metal targets. Second, we have measured the energy dependence of the yield of the sputtered ions from the surface of solid targets of conductive materials (C, Al) bombarded by Xe q+ (q=30,36,44) between 76 keV (v p =0.15 a.u) and 6.0 MeV (v p =1.3 a.u). A broad enhancement of the secondary ion yield has been found for Al target bombarded by Xe 44+ . From these experimental results, the electronic excitation effects in conductive materials for impact of slow highly charged heavy ions bearing high potential energy is discussed

Real-time detection of antibiotic activity by measuring nanometer-scale bacterial deformation

Science.gov (United States)

Iriya, Rafael; Syal, Karan; Jing, Wenwen; Mo, Manni; Yu, Hui; Haydel, Shelley E.; Wang, Shaopeng; Tao, Nongjian

2017-12-01

Diagnosing antibiotic-resistant bacteria currently requires sensitive detection of phenotypic changes associated with antibiotic action on bacteria. Here, we present an optical imaging-based approach to quantify bacterial membrane deformation as a phenotypic feature in real-time with a nanometer scale (˜9 nm) detection limit. Using this approach, we found two types of antibiotic-induced membrane deformations in different bacterial strains: polymyxin B induced relatively uniform spatial deformation of Escherichia coli O157:H7 cells leading to change in cellular volume and ampicillin-induced localized spatial deformation leading to the formation of bulges or protrusions on uropathogenic E. coli CFT073 cells. We anticipate that the approach will contribute to understanding of antibiotic phenotypic effects on bacteria with a potential for applications in rapid antibiotic susceptibility testing.

Spot size predictions of a focused ion beam based on laser cooling

NARCIS (Netherlands)

Haaf, ten G.; Wouters, S.H.W.; Geer, van der S.B.; Mutsaers, P.H.A.; Luiten, O.J.; Vredenbregt, E.J.D.

2014-01-01

The Atomic Beam Laser Cooled Ion Source (ABLIS) is a new source for focused ion beam instruments, which are used in the semiconductor industry, to image and modify structures on the nanometer length scale. The ABLIS employs laser cooling and compression of an atomic beam of rubidium to increase its

Local mechanical spectroscopy with nanometer-scale lateral resolution

Science.gov (United States)

Oulevey, F.; Gremaud, G.; Sémoroz, A.; Kulik, A. J.; Burnham, N. A.; Dupas, E.; Gourdon, D.

1998-05-01

A new technique has been developed to probe the viscoelastic and anelastic properties of submicron phases of inhomogeneous materials. The measurement gives information related to the internal friction and to the variations of the dynamic modulus of nanometer-sized volumes. It is then the nanoscale equivalent to mechanical spectroscopy, a well-known macroscopic technique for materials studies, also sometimes called dynamic mechanical (thermal) analysis. The technique is based on a scanning force microscope, using the principle of scanning local-acceleration microscopy (SLAM), and allows the sample temperature to be changed. It is called variable-temperature SLAM, abbreviated T-SLAM. According to a recent proposition to systematize names of scanning probe microscope based methods, this technique should be included in the family of "mechanothermal analysis with scanning microscopy." It is suited for studying defect dynamics in nanomaterials and composites by locating the dissipative mechanisms in submicron phases. The primary and secondary relaxations, as well as the viscoplasticity, were observed in bulk PVC. The wide range of phenomena demonstrate the versatility of the technique. A still unexplained increase of the stiffness with increasing temperature was observed just below the glass transition. All of these observations, although their interpretation in terms of physical events is still tentative, are in agreement with global studies. This technique also permits one to image the variations of the local elasticity or of the local damping at a fixed temperature. This enables the study of, for instance, the homogeneity of phase transitions in multiphased materials, or of the interface morphologies and properties. As an illustration, the homogeneity of the glass transition temperature of PVC in a 50/50 wt % PVC/PB polymer blend has been demonstrated. Due to the small size of the probed volume, T-SLAM gives information on the mechanical properties of the near

The matrix effect in secondary ion mass spectrometry

Science.gov (United States)

Seah, M. P.; Shard, A. G.

2018-05-01

Matrix effects in the secondary ion mass spectrometry (SIMS) of selected elemental systems have been analyzed to investigate the applicability of a mathematical description of the matrix effect, called here the charge transfer (CT) model. This model was originally derived for proton exchange and organic positive secondary ions, to characterise the enhancement or suppression of intensities in organic binary systems. In the systems considered in this paper protons are specifically excluded, which enables an assessment of whether the model applies for electrons as well. The present importance is in organic systems but, here we analyse simpler inorganic systems. Matrix effects in elemental systems cannot involve proton transfer if there are no protons present but may be caused by electron transfer and so electron transfer may also be involved in the matrix effects for organic systems. There are general similarities in both the magnitudes of the ion intensities as well as the matrix effects for both positive and negative secondary ions in both systems and so the CT model may be more widely applicable. Published SIMS analyses of binary elemental mixtures are analyzed. The data of Kim et al., for the Pt/Co system, provide, with good precision, data for such a system. This gives evidence for the applicability of the CT model, where electron, rather than proton, transfer is the matrix enhancing and suppressing mechanism. The published data of Prudon et al., for the important Si/Ge system, provides further evidence for the effects for both positive and negative secondary ions and allows rudimentary rules to be developed for the enhancing and suppressing species.

Probing dynamics and pinning of single vortices in superconductors at nanometer scales

Science.gov (United States)

Embon, L.; Anahory, Y.; Suhov, A.; Halbertal, D.; Cuppens, J.; Yakovenko, A.; Uri, A.; Myasoedov, Y.; Rappaport, M. L.; Huber, M. E.; Gurevich, A.; Zeldov, E.

2015-01-01

The dynamics of quantized magnetic vortices and their pinning by materials defects determine electromagnetic properties of superconductors, particularly their ability to carry non-dissipative currents. Despite recent advances in the understanding of the complex physics of vortex matter, the behavior of vortices driven by current through a multi-scale potential of the actual materials defects is still not well understood, mostly due to the scarcity of appropriate experimental tools capable of tracing vortex trajectories on nanometer scales. Using a novel scanning superconducting quantum interference microscope we report here an investigation of controlled dynamics of vortices in lead films with sub-Angstrom spatial resolution and unprecedented sensitivity. We measured, for the first time, the fundamental dependence of the elementary pinning force of multiple defects on the vortex displacement, revealing a far more complex behavior than has previously been recognized, including striking spring softening and broken-spring depinning, as well as spontaneous hysteretic switching between cellular vortex trajectories. Our results indicate the importance of thermal fluctuations even at 4.2 K and of the vital role of ripples in the pinning potential, giving new insights into the mechanisms of magnetic relaxation and electromagnetic response of superconductors.

Dimensional crossover in fluids under nanometer-scale confinement.

Science.gov (United States)

Das, Amit; Chakrabarti, J

2012-05-01

Several earlier studies have shown signatures of crossover in various static and dynamics properties of a confined fluid when the confining dimension decreases to about a nanometer. The density fluctuations govern the majority of such properties of a fluid. Here, we illustrate the crossover in density fluctuation in a confined fluid, to provide a generic understanding of confinement-induced crossover of fluid properties, using computer simulations. The crossover can be understood as a manifestation of changes in the long-wavelength behavior of fluctuation in density due to geometrical constraints. We further show that the confining potential significantly affects the crossover behavior.

Irradiation effects on secondary structure of protein induced by keV ions

International Nuclear Information System (INIS)

Cui, F.Z.; Lin, Y.B.; Zhang, D.M.; Tian, M.B.

2001-01-01

Protein secondary structure changes by low-energy ion irradiation are reported for the first time. The selected system is 30 keV N + irradiation on bovine serum albumin (BSA). After irradiation at increasing fluences from 1.0x10 15 to 2.5x10 16 ion/cm 2 , Fourier transform infrared spectra analysis was conducted. It was found that the secondary structures of BSA molecules were very sensitive to ion irradiation. Secondary conformations showed different trends of change during irradiation. With the increase of ion fluence from 0 to 2.5x10 16 ion/cm 2 , the fraction of α-helix and β-turns decreased from 17 to 12%, and from 40 to 31%, respectively, while that of random coil and β-sheet structure increased from 18 to 27%, and from 25 to 30%, respectively. Possible explanations for the secondary conformational changes of protein are proposed. (author)

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Energy Technology Data Exchange (ETDEWEB)

Mahoney, Christine M. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)]. E-mail: christine.mahoney@nist.gov; Fahey, Albert J. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Gillen, Greg [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Xu Chang [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Batteas, James D. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)

2006-07-30

Secondary ion mass spectrometry (SIMS) employing an SF{sub 5} {sup +} polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from -125 deg. C to 150 deg. C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced interfacial widths as compared to analysis at ambient temperature. Atomic force microscopy (AFM) images indicated that this improvement in interfacial width may be related to a decrease in sputter-induced topography. Depth profiling at higher temperatures was typically correlated with increased sputter rates. However, the improvements in interfacial widths and overall secondary ion stability were not as prevalent as was observed at low temperature. For PLA, improvements in signal intensities were observed at low temperatures, yet there was no significant change in secondary ion stability, interface widths or sputter rates. High temperatures yielded a significant decrease in secondary ion stability of the resulting profiles. PS films showed rapid degradation of characteristic secondary ion signals under all temperatures examined.

Nanometals - Status and perspective

International Nuclear Information System (INIS)

Faester, S.; Hansen, N.; Huang, X.; Juul Jensen, D.; Ralph, B.

2012-01-01

Nanometals and nanotechnology have over the years been covered in papers, books and conferences - also in many Risoe International Symposia, where the 30th in 2009 dealt solely with nanostructured metals. Since then, rapid progress has been made in synthesis, characterization and modeling, and it is timely to discuss status and perspective also with a view on applications in an international forum such as the Risoe Symposium. Both keynote and contributed papers address important current problems illustrating global research and development in this field. Examples are the development of new synthesis techniques followed by characterization and modeling of microstructures both in 2D and 3D now starting to bridge the micrometer scales. The vital area of mechanical behavior is addressed by the development of new testing techniques and a broad effort to characterize and model mechanical properties of metals strengthened by dislocations and twins. This research has now led to new understanding of both strengthening mechanisms and strengh structure relationships based on experiments in combination with analytical and numerical modeling. The holistic approach to research on nanometals demonstrated by these proceedings can guide both scientists and technologists in their future work also with the aim of introducing into society this new group of advanced materials. Such an effort is important, as science and technology today is significantly affected by politics of governments and international institutions, and therefore a new initiative in the pressent is to include a discussion of research and development in the area of nanometals i USA, China and Japan. (Author)

Nanometals - Status and perspective

Energy Technology Data Exchange (ETDEWEB)

Faester, S.; Hansen, N.; Huang, X.; Juul Jensen, D.; Ralph, B. (eds.)

2012-11-01

Nanometals and nanotechnology have over the years been covered in papers, books and conferences - also in many Risoe International Symposia, where the 30th in 2009 dealt solely with nanostructured metals. Since then, rapid progress has been made in synthesis, characterization and modeling, and it is timely to discuss status and perspective also with a view on applications in an international forum such as the Risoe Symposium. Both keynote and contributed papers address important current problems illustrating global research and development in this field. Examples are the development of new synthesis techniques followed by characterization and modeling of microstructures both in 2D and 3D now starting to bridge the micrometer scales. The vital area of mechanical behavior is addressed by the development of new testing techniques and a broad effort to characterize and model mechanical properties of metals strengthened by dislocations and twins. This research has now led to new understanding of both strengthening mechanisms and strengh structure relationships based on experiments in combination with analytical and numerical modeling. The holistic approach to research on nanometals demonstrated by these proceedings can guide both scientists and technologists in their future work also with the aim of introducing into society this new group of advanced materials. Such an effort is important, as science and technology today is significantly affected by politics of governments and international institutions, and therefore a new initiative in the pressent is to include a discussion of research and development in the area of nanometals i USA, China and Japan. (Author)

Secondary ion formation during electronic and nuclear sputtering of germanium

Science.gov (United States)

Breuer, L.; Ernst, P.; Herder, M.; Meinerzhagen, F.; Bender, M.; Severin, D.; Wucher, A.

2018-06-01

Using a time-of-flight mass spectrometer attached to the UNILAC beamline located at the GSI Helmholtz Centre for Heavy Ion Research, we investigate the formation of secondary ions sputtered from a germanium surface under irradiation by swift heavy ions (SHI) such as 5 MeV/u Au by simultaneously recording the mass spectra of the ejected secondary ions and their neutral counterparts. In these experiments, the sputtered neutral material is post-ionized via single photon absorption from a pulsed, intensive VUV laser. After post-ionization, the instrument cannot distinguish between secondary ions and post-ionized neutrals, so that both signals can be directly compared in order to investigate the ionization probability of different sputtered species. In order to facilitate an in-situ comparison with typical nuclear sputtering conditions, the system is also equipped with a conventional rare gas ion source delivering a 5 keV argon ion beam. For a dynamically sputter cleaned surface, it is found that the ionization probability of Ge atoms and Gen clusters ejected under electronic sputtering conditions is by more than an order of magnitude higher than that measured for keV sputtered particles. In addition, the mass spectra obtained under SHI irradiation show prominent signals of GenOm clusters, which are predominantly detected as positive or negative secondary ions. From the m-distribution for a given Ge nuclearity n, one can deduce that the sputtered material must originate from a germanium oxide matrix with approximate GeO stoichiometry, probably due to residual native oxide patches even at the dynamically cleaned surface. The results clearly demonstrate a fundamental difference between the ejection and ionization mechanisms in both cases, which is interpreted in terms of corresponding model calculations.

Probing Rubber Cross-Linking Generation of Industrial Polymer Networks at Nanometer Scale.

Science.gov (United States)

Gabrielle, Brice; Gomez, Emmanuel; Korb, Jean-Pierre

2016-06-23

We present improved analyses of rheometric torque measurements as well as (1)H double-quantum (DQ) nuclear magnetic resonance (NMR) buildup data on polymer networks of industrial compounds. This latter DQ NMR analysis allows finding the distribution of an orientation order parameter (Dres) resulting from the noncomplete averaging of proton dipole-dipole couplings within the cross-linked polymer chains. We investigate the influence of the formulation (filler and vulcanization systems) as well as the process (curing temperature) ending to the final polymer network. We show that DQ NMR follows the generation of the polymer network during the vulcanization process from a heterogeneous network to a very homogeneous one. The time variations of microscopic Dres and macroscopic rheometric torques present power-law behaviors above a threshold time scale with characteristic exponents of the percolation theory. We observe also a very good linear correlation between the kinetics of Dres and rheometric data routinely performed in industry. All these observations confirm the description of the polymer network generation as a critical phenomenon. On the basis of all these results, we believe that DQ NMR could become a valuable tool for investigating in situ the cross-linking of industrial polymer networks at the nanometer scale.

Suppression secondary electrons from target surface under pulsed ion beams bombardment

International Nuclear Information System (INIS)

Yang Zhen; Peng Yufei; Long Jidong; Lan Chaohui; Dong Pan; Shi Jinshui

2012-01-01

The producing mechanism of secondary electrons from target surface under ion beams bombardment is discussed. Several methods to suppress the secondary electrons in special vacuum devices and their advantages and disadvantages are introduced. The ways of using self-bias and curved surface target are proposed and verified in the experiment. The results show that the secondary electrons can be effectively suppressed when the self-bias is larger than 80 V. The secondary electron yield decreases by using curved surface target instead of flat target. The secondary electron yield calculated from the experimental data is about 0.67, which is slightly larger than the value (0.58) from the literature due to the impurities of the ion beam and target surface. The effect of suppressing the electron countercurrent by the self-bias method is analyzed. The result shows that the self-bias method can not only suppress the secondary electrons from target surface under ion beams bombardment, but also suppress the electron countercurrent resulting from the instability of the pulsed power source. (authors)

Simultaneous study of sputtering and secondary ion emission of binary Fe-based alloys

International Nuclear Information System (INIS)

Riadel, M.M.; Nenadovic, T.; Perovic, B.

1976-01-01

The sputtering and secondary ion emission of binary Fe-based alloys of simple phase diagrams have been studied simultaneously. A series FeNi and FeCr alloys in the concentration range of 0-100% have been bombarded by 4 keV Kr + ions in a secondary ion mass spectrometer. The composition of the secondary ions has been analysed and also a fraction of the sputtered material has been collected and analysed by electron microprobe. The surface topography of the etched samples has been studied by scanning electron microscope. The relative sputtering coefficients of the metals have been determined, and the preferential sputtering of the alloying component of lower S have been proved. The etching pictures of samples are in correlation with the sputtering rates. Also the degree of secondary ionization has been calculated from the simultaneously measured ion emission and sputtering data. α + shows the change in the concentration range of the melting point minimum. This fact emphasizes the connection between the physico-chemical properties of alloys and their secondary emission process. From the dependence of the emitted homo- and hetero-cluster ions, conclusions could be shown concerning the production mechanism of small metallic aggregates

Non-invasive monitoring of therapeutic carbon ion beams in a homogeneous phantom by tracking of secondary ions

Science.gov (United States)

Gwosch, K.; Hartmann, B.; Jakubek, J.; Granja, C.; Soukup, P.; Jäkel, O.; Martišíková, M.

2013-06-01

Radiotherapy with narrow scanned carbon ion beams enables a highly accurate treatment of tumours while sparing the surrounding healthy tissue. Changes in the patient’s geometry can alter the actual ion range in tissue and result in unfavourable changes in the dose distribution. Consequently, it is desired to verify the actual beam delivery within the patient. Real-time and non-invasive measurement methods are preferable. Currently, the only technically feasible method to monitor the delivered dose distribution within the patient is based on tissue activation measurements by means of positron emission tomography (PET). An alternative monitoring method based on tracking of prompt secondary ions leaving a patient irradiated with carbon ion beams has been previously suggested. It is expected to help in overcoming the limitations of the PET-based technique like physiological washout of the beam induced activity, low signal and to allow for real-time measurements. In this paper, measurements of secondary charged particle tracks around a head-sized homogeneous PMMA phantom irradiated with pencil-like carbon ion beams are presented. The investigated energies and beam widths are within the therapeutically used range. The aim of the study is to deduce properties of the primary beam from the distribution of the secondary charged particles. Experiments were performed at the Heidelberg Ion Beam Therapy Center, Germany. The directions of secondary charged particles emerging from the PMMA phantom were measured using an arrangement of two parallel pixelated silicon detectors (Timepix). The distribution of the registered particle tracks was analysed to deduce its dependence on clinically important beam parameters: beam range, width and position. Distinct dependencies of the secondary particle tracks on the properties of the primary carbon ion beam were observed. In the particular experimental set-up used, beam range differences of 1.3 mm were detectable. In addition, variations

Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

Science.gov (United States)

Bogdanović Radović, Iva; Siketić, Zdravko; Jembrih-Simbürger, Dubravka; Marković, Nikola; Anghelone, Marta; Stoytschew, Valentin; Jakšić, Milko

2017-09-01

Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.

Transient effects in SIMS analysis of Si with Cs sup + at high incidence angles Secondary ion yield variations

CERN Document Server

Heide, P A W

2002-01-01

Secondary ion mass spectrometry (SIMS) depth profile analysis of Si wafers using 1 keV Cs sup + primary ions at large incidence angles (80 deg. ) is plagued by unusually strong transient effects (variations in both sputter and ion yields). Analysis of a native oxide terminated Si wafer with and without the aid of an O sub 2 leak, and an Ar sup + pre-sputtered wafer revealed correlations between the implanted Cs content and various secondary ion intensities consistent with that expected from a resonance charge transfer process (that assumed by the electron tunneling model). Cs concentrations were defined through X-ray photoelectron spectroscopy of the sputtered surface from SIMS profiles terminated within the transient region. These scaled with the surface roughening occurring under these conditions and can be explained as resulting from the associated drop in sputter rates. An O induced transient effect from the native oxide was also identified. Characterization of these effects allowed the reconstruction of ...

Visualization of hydrogen in steels by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Takai, Kenichi

2000-01-01

Secondary ion mass spectrometry (SIMS) enables us to visualize hydrogen trapping sites in steels. Information about the hydrogen trapping sites in high-strength steels by SIMS is very important to discuss environmental embrittlement mechanism for developing steels with a high resistance to the environmental embrittlement. Secondary ion image analysis by SIMS has made possible to visualize the hydrogen and deuterium trapping sites in the steels. Hydrogen in tempered martensite steels containing Ca tends to accumulate on inclusions, at grain boundaries, and in segregation bands. Visualization of hydrogen desorption process by secondary ion image analysis confirms that the bonding between the inclusions and the hydrogen is strong. Cold-drawn pearlite steels trap hydrogen along cold-drawing direction. Pearlite phase absorbs the hydrogen more than ferrite phase does. This article introduces the principle of SIMS, its feature, analysis method, and results of hydrogen visualization in steels. (author)

Innovation and its Management as Observed in the Lithium Ion Secondary Battery Business

OpenAIRE

正本, 順三

2008-01-01

At present, mobile phones and laptop computers are essential items in our daily life. As a battery for such portable devices, the lithium ion secondary battery is used. The lithium ion secondary battery, which is used as a battery for such portable devices, was first invented by Dr. Yoshino at Asahi Kasei, where the present author formerly worked. In this paper, the author describes how the lithium ion secondary battery was developed by the inventor, how the technology originated in Japan and...

Some applications of nanometer scale structures for current and future X-ray space research

DEFF Research Database (Denmark)

Christensen, Finn Erland; Abdali, S; Frederiksen, P K

1994-01-01

Nanometer scale structures such as multilayers, gratings and natural crystals are playing an increasing role in spectroscopic applications for X-ray astrophysics. A few examples are briefly described as an introduction to current and planned applications pursued at the Danish Space Research...... Institute in collaboration with the FOM Institute for Plasma Physics, Nieuwegein, the Max-Planck-Institut für Extraterrestrische Physik, Aussenstelle Berlin, the Space Research Institute, Russian Academy of Sciences, the Smithsonian Astrophysical Observatory, Ovonics Synthetic Materials Company and Lawrence...... Livermore National Laboratory. These examples include : 1. the application of multilayered Si crystals for simultaneous spectroscopy in two energy bands one centred around the SK-emission near 2.45 keV and the other below the CK absorption edge at 0.284 keV; 2. the use of in-depth graded period multilayer...

Surface effects on ionic Coulomb blockade in nanometer-size pores.

Science.gov (United States)

Tanaka, Hiroya; Iizuka, Hideo; Pershin, Yuriy V; Ventra, Massimiliano Di

2018-01-12

Ionic Coulomb blockade in nanopores is a phenomenon that shares some similarities but also differences with its electronic counterpart. Here, we investigate this phenomenon extensively using all-atom molecular dynamics of ionic transport through nanopores of about one nanometer in diameter and up to several nanometers in length. Our goal is to better understand the role of atomic roughness and structure of the pore walls in the ionic Coulomb blockade. Our numerical results reveal the following general trends. First, the nanopore selectivity changes with its diameter, and the nanopore position in the membrane influences the current strength. Second, the ionic transport through the nanopore takes place in a hopping-like fashion over a set of discretized states caused by local electric fields due to membrane atoms. In some cases, this creates a slow-varying 'crystal-like' structure of ions inside the nanopore. Third, while at a given voltage, the resistance of the nanopore depends on its length, the slope of this dependence appears to be independent of the molarity of ions. An effective kinetic model that captures the ionic Coulomb blockade behavior observed in MD simulations is formulated.

Surface effects on ionic Coulomb blockade in nanometer-size pores

Science.gov (United States)

Tanaka, Hiroya; Iizuka, Hideo; Pershin, Yuriy V.; Di Ventra, Massimiliano

2018-01-01

Ionic Coulomb blockade in nanopores is a phenomenon that shares some similarities but also differences with its electronic counterpart. Here, we investigate this phenomenon extensively using all-atom molecular dynamics of ionic transport through nanopores of about one nanometer in diameter and up to several nanometers in length. Our goal is to better understand the role of atomic roughness and structure of the pore walls in the ionic Coulomb blockade. Our numerical results reveal the following general trends. First, the nanopore selectivity changes with its diameter, and the nanopore position in the membrane influences the current strength. Second, the ionic transport through the nanopore takes place in a hopping-like fashion over a set of discretized states caused by local electric fields due to membrane atoms. In some cases, this creates a slow-varying ‘crystal-like’ structure of ions inside the nanopore. Third, while at a given voltage, the resistance of the nanopore depends on its length, the slope of this dependence appears to be independent of the molarity of ions. An effective kinetic model that captures the ionic Coulomb blockade behavior observed in MD simulations is formulated.

A direct and at nanometer scale study of electrical charge distribution on membranes of alive cells

Directory of Open Access Journals (Sweden)

Marlière Christian

2016-01-01

Full Text Available In this paper is presented an innovative method to map in-vivo and at nanometer scale the electrical charge distribution on membranes of alive cells. It relies on a new atomic force microscopy (AFM mode based on an electro-mechanical coupling effect. Furthermore, an additional electrical signal detected by both the deflection of the AFM cantilever and simultaneous direct current measurements was detected at low scanning rates. It was attributed to the detection of the current stemming from ionic channels. It opens a new way to directly investigate in situ biological electrical surface processes involved in bacterial adhesion, biofilm formation, microbial fuel cells, etc.

Micrometer and nanometer scale photopatterning of proteins on glass surfaces by photo-degradation of films formed from oligo(ethylene glycol) terminated silanes.

Science.gov (United States)

Tizazu, Getachew; el Zubir, Osama; Patole, Samson; McLaren, Anna; Vasilev, Cvetelin; Mothersole, David J; Adawi, Ali; Hunter, C Neil; Lidzey, David G; Lopez, Gabriel P; Leggett, Graham J

2012-12-01

Exposure of films formed by the adsorption of oligo(ethylene glycol) (OEG) functionalized trichlorosilanes on glass to UV light from a frequency-doubled argon ion laser (244 nm) causes photodegradation of the OEG chain. Although the rate of degradation is substantially slower than for monolayers of OEG terminated thiolates on gold, it is nevertheless possible to form micrometer-scale patterns by elective adsorption of streptavidin to exposed regions. A low density of aldehyde functional groups is produced, and this enables derivatization with nitrilotriacetic acid via an amine linker. Complexation with nickel enables the site-specific immobilization of histidine-tagged yellow and green fluorescent proteins. Nanometer-scale patterns may be fabricated using a Lloyd's mirror interferometer, with a sample and mirror set at right angles to each other. At low exposures, partial degradation of the OEG chains does not remove the protein-resistance of the surface, even though friction force microscopy reveals the formation of patterns. At an exposure of ca. 18 J cm(-2), the modified regions became adhesive to proteins in a narrow region ca. 30 nm (λ/8) wide. As the exposure is increased further the lines quickly broaden to ca. 90 nm. Adjustment of the angle between the sample and mirror enables the fabrication of lines of His-tagged green fluorescent protein at a period of 340 nm that could be resolved using a confocal microscope.

Mass spectrometric study of the negative and positive secondary ions emitted from ethanol microdroplets by MeV-energy heavy ion impact

Science.gov (United States)

Kitajima, Kensei; Majima, Takuya; Nishio, Tatsuya; Oonishi, Yoshiki; Mizutani, Shiori; Kohno, Jun-ya; Saito, Manabu; Tsuchida, Hidetsugu

2018-06-01

We have investigated the negative and positive secondary ions emitted from ethanol droplets by 4.0-MeV C3+ impact to reveal the characteristic features of the reaction processes induced by fast heavy ions at the liquid ethanol surface. Analysis of the secondary ions was performed by time-of-flight mass spectrometry for microdroplet targets in a high vacuum environment. Fragment ions, deprotonated cluster ions, and trace amounts of the reaction product ions are observed in the negative secondary ions. The main fragment anions are C2HmO- (m = 1, 3, and 5) and C2H- generated by loss of hydrogen and oxygen atoms. The reaction product anions include deprotonated glycols, larger alcohols, and their dehydrated and dehydrogenated forms generated by secondary reactions between fragments and radicals. Furthermore, C3Hm- (m = 0-2) and C4Hm- (m = 0 and 1) are observed, which could be produced through a plasma state generated in the heavy ion track. Deprotonated ethanol cluster ions, [(EtOH)n - H]-, are observed up to about n = 25. [(EtOH)n - H]- have smaller kinetic energies than the protonated cluster ions (EtOH)nH+. This probably represents the effect of the positive Coulomb potential transiently formed in the ion track. We also discuss the size distributions and structures of the water- and CH2OH-radical-attached ethanol cluster ions.

Simulation study of secondary electron images in scanning ion microscopy

CERN Document Server

Ohya, K

2003-01-01

The target atomic number, Z sub 2 , dependence of secondary electron yield is simulated by applying a Monte Carlo code for 17 species of metals bombarded by Ga ions and electrons in order to study the contrast difference between scanning ion microscopes (SIM) and scanning electron microscopes (SEM). In addition to the remarkable reversal of the Z sub 2 dependence between the Ga ion and electron bombardment, a fine structure, which is correlated to the density of the conduction band electrons in the metal, is calculated for both. The brightness changes of the secondary electron images in SIM and SEM are simulated using Au and Al surfaces adjacent to each other. The results indicate that the image contrast in SIM is much more sensitive to the material species and is clearer than that for SEM. The origin of the difference between SIM and SEM comes from the difference in the lateral distribution of secondary electrons excited within the escape depth.

Effect of energy selection on quantitative analysis in secondary ion microanalysis

International Nuclear Information System (INIS)

Steele, I.M.; Solberg, T.N.; Smith, J.V.; Clayton, R.N.; Hutcheon, I.D.

1977-01-01

Systematic change of voltage on the components of the secondary ion (SI) extraction system of our AEI-IM20 ion microprobe produced major changes of relative intensities of secondary ions passing through the mass spectrometer. The repeller, which bends the SI beam through about 60 0 , has the greatest effect, and can be used to plot the energy distribution. The extractor and the deflecting and focusing components have smaller but significant effects. Because low-energy secondary ions have a near-symmetrical distribution, whereas high-energy ones have an assymetric distribution favoring high energies, tuning of the acceptance band to higher energy reduces interference from low-energy ions, which tend to be unwanted molecular ions, at the expense of reduced transmission. Tuning to lower energy increases interference but gives higher transmission. The former condition is desirable for instruments restricted to low mass resolution, whereas both conditions are valuable for instruments adjustable for both high and low mass resolution. Other important factors are (a) sensitivity to surface irregularities which perturb SI energy collection, and (b) change in derived 'temperatures' from thermodynamic sputtering models merely from tuning the energy acceptance band. Careful attention to the above factors yielded reproducible SI ratios for the binary series of plagioclase feldspars. (Auth.)

Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)

Science.gov (United States)

Hervig, R. L.; Chen, J.; Schauer, S.; Stanley, B. D.; Moore, G. M.; Roggensack, K.

2012-12-01

In secondary ion mass spectrometry (SIMS), a sample is bombarded by a charged particle beam (the primary ion) and sputtered positive or negative secondary ions are analyzed in a mass spectrometer. When the target is not conducting (like many geological materials), sample charging can result in variable deflection of secondary ions away from the mass spectrometer and a low, unstable, or absent signal. Applying a thin conducting coat (e.g., C, Au) to polished samples is required, and if the primary ion beam is negatively-charged, the build-up of negative charge can be alleviated by secondary electrons draining to the conducting coat at the edge of the crater (if a positive potential is applied to the sample for the collection of positive secondary ions) or accelerated away from the crater (if a negative potential is applied for negative ion study). Unless the sputtered crater in the conducting coat becomes too large, sample charging can be kept at a controllable level, and high-quality trace element analyses and isotope ratios have been obtained using this technique over the past 3+ decades. When a positive primary beam is used, the resulting build-up of positive charge in the sample requires an electron gun to deliver sufficient negative charge to the sputtered crater. While there are many examples of successful analyses using this approach, the purpose of this presentation is to describe a very simple technique for aligning the electron gun on Cameca nf and 1270/80 SIMS instruments. This method allows reproducible analyses of insulating phases with a Cs+ primary beam and detection of negative secondary ions. Normally, the filament voltage on the E-gun is the same as the sample voltage; thus electrons do not strike the sample except when a positive charge has built up (e.g., in the analysis crater!). In this method, we decrease the sample voltage by 3 or more kV, so that the impact energy of the electrons is sufficient to induce a cathodoluminescent (CL) image on an

Ion implantation artifacts observed in depth profiling boron in silicon by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Chi, P.; Simons, D.S.

1987-01-01

A comparison study of depth profiling by secondary ion mass spectrometry (SIMS) and neutron depth profiling (NDP) was recently conducted. The specimens were portions of 5 cm diameter single crystal silicon slices in which B-10 had been implanted at various fluences and energies. NDP measurements were made on a 13 mm diameter area at the center of the wafers. SIMS measurements were taken from a 60 μm diameter area approximately 16 mm from the center of the wafer. One observation that emerged from this work was an apparent discrepancy between the profiles of B-10 measured by DNP and SIMS. The peaks of the SIMS profiles were typically deeper than those of NDP by as much as 30 nm, which is 10% of the projected range for a 70 keV implant. Moreover, the profiles could not be made to coincide by either a constant shift or a proportional change of one depth scale with respect to the other. The lateral inhomogeneity of boron that these experiments have demonstrated arises from the variable contribution of ion channeling during implantation

Negative secondary ion emission from oxidized surfaces

International Nuclear Information System (INIS)

Gnaser, H.; Kernforschungsanlage Juelich G.m.b.H.

1984-01-01

The emission of negative secondary ions from 23 elements was studied for 10 keV O 2 + and 10 keV In + impact at an angle of incidence of 45 0 . Partial oxidation of the sample surfaces was achieved by oxygen bombardment and/or by working at a high oxygen partial pressure. It was found that the emission of oxide ions shows an element-characteristic pattern. For the majority of the elements investigated these features are largely invariant against changes of the surface concentration of oxygen. For the others admission of oxygen strongly changes the relative intensities of oxide ions: a strong increase of MO 3 - signals (M stands for the respective element) is accompanied by a decrease of MO - and M - intensities. Different primary species frequently induce changes of both the relative and the absolute negative ion intensities. Carbon - in contrast to all other elements - does not show any detectable oxide ion emission but rather intense cluster ions Csub(n) - (detected up to n=12) whose intensities oscillate in dependence on n. (orig./RK)

Investigations on Cu-Ni and Cu-Al systems with secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Rodriguez-Murcia, H.; Beske, H.E.

1976-04-01

The ratio of the ionization coefficients of secondary atomic ions emitted from the two component systems Cu-Ni and Cu-Al was investigated as a function of the concentration of the two components. In the low concentration range the ratio of the ionization coefficients is a constant. An influence of the phase composition on the ratio of the ionization coefficients was found in the Cu-Al system. In addition, the cluster ion emission was investigated as a function of the concentration and the phase composition of the samples. The secondary atomic ion intensity was influenced by the presence of cluster ions. The importance of the cluster ions in quantitative analysis and phase determination by means of secondary ion mass spectrometry are discussed. (orig.) [de

An investigation of the mass spectra of secondary ions ejected from the single crystal surface of semiconductors

International Nuclear Information System (INIS)

Koval', A.G.; Mel'nikov, V.N.; Enukov, Yu.V.

1976-01-01

The mass spectra of secondary positive and negative ions, ejected by an Ar + ion beam from the (100) face of an epitaxial film of the semiconductor Alsub(x)Gasub(1-x)As were investigated. There are many various secondary ions in the mass spectrum under investigation. They may be divided into four groups according to their origins. Mass spectra of secondary positive and negative secondary ions differ much, either in their composition or the intensities of homogeneous ions. The I(T) dependences (I=the current of corresponding secondary ions, T=target temperature) were obtained for secondary and negative ions taken from groups differing by their origin. The I(T) dependences were obtained at several oxygen pressures in a chamber. For the ions with 'superficial' origin a strong dependence of their current on target temperature is observed. Oxygen pressure increase leads to substantial change of the I(T)curves. (Auth.)

Surface and grain boundary interdiffusion in nanometer-scale LSMO/BFO bilayer

Energy Technology Data Exchange (ETDEWEB)

Kumar, Virendra [Department of Physics, National Institute of Technology, Kurukshetra 136119 (India); Gaur, Anurag, E-mail: anuragdph@gmail.com [Department of Physics, National Institute of Technology, Kurukshetra 136119 (India); Choudhary, R.J.; Gupta, Mukul [UGC-DAE Consortium for Scientific Research, Indore 452 001 (India)

2016-05-01

Epitaxial 150 nm thick LSMO/BFO bilayer is deposited on STO (100) substrate by pulsed laser deposition, to study magnetoelectric effect. Unexpected low value of room temperature magnetization in bilayer indicates towards the possibility of interdiffusion. Further, sharp fall in the value of T{sub C} (53 K) also added our anxiety towards possible interdiffusion in BFO/LSMO system. Low-angle x-ray diffraction technique is used to investigate interdiffusion phenomena, and the temperature-dependent interdiffusivity is obtained by accurately monitoring the decay of the first-order modulation peak as a function of annealing time. It has been found that the diffusivity at different temperatures follows Arrhenius-type behavior. X-ray reflection (XRR) pattern obtained for the bilayer could not be fitted in the Parratt’s formalism, which confirms the interdiffusion in it. Depth profiles of {sup 209}Bi, {sup 56}Fe ions measured by secondary ion mass spectroscope (SIMS) further substantiate the diffusion of these ions from upper BFO layer into lower LSMO layer. - Highlights: • The LSMO/BFO bilayer is deposited by PLD method. • Structural, magnetic and interfacial properties of deposited films were studied. • In this article, we have raised the problem of interdiffusion in this bilayer, which can hinder its application in devices. Therefore, we feel that our article presents important finding in the area of ceramics research.

Depth resolution of secondary ion mass spectrometry

International Nuclear Information System (INIS)

Pustovit, A.N.

2004-01-01

The effect of the solid body discreteness in the direction of the normal to the sample surface on the depth resolution of the secondary ion mass spectrometry method is analyzed. It is shown that for this case the dependence of the width at the semi-height of the delta profiles of the studied elements depth distribution on the energy and angle of incidence of the initial ions should have the form of the stepwise function. This is experimentally proved by the silicon-germanium delta-layers in the silicon samples [ru

High resolution studies by Secondary Ion Mass Spectrometry of the spatial distribution of tritium in neutron irradiated beryllium pebbles

International Nuclear Information System (INIS)

Rabaglino, E.; Tamborini, G.; Hiernaut, J.-P.; Betti, M.

2006-01-01

A key issue of beryllium as a neutron multiplier in the blanket of future fusion reactors is tritium retention. Models are under development in order to predict tritium release kinetics in the typical operating conditions of the material in the blanket: the absence of experimental data in this range imposes an extrapolation of the models, therefore a detailed characterization and understanding of microscopic diffusion phenomena related to macroscopic tritium release is necessary. It has been recently shown, that the availability of evidence on such phenomena at a scale of 1 micron down to tens of nanometers enables a relevant progress in the effectiveness of model validation: therefore the need for applying and developing advanced analytical techniques based on mass spectrometry at this scale. A study of tritium spatial distribution in neutron irradiated beryllium pebbles (2 mm diameter, 480 appm 4 He, 7 appm 3 H) by means of Secondary Ion Mass Spectrometry (SIMS) is presented. Samples in different conditions (non-irradiated, at end of irradiation and at different temperatures during thermal ramp annealing) are examined by an oxygen ion primary beam with a spatial resolution of 1 micron along a diameter. The sample preparation is optimized in order to enable a quantitative comparison among the different conditions. Under an oxygen ion beam tritium is detected in the irradiated samples in a molecular form (3H 2 ), with a continuous distribution inside the grains, which suggests the presence of small clusters in agreement with TEM analyses, and in the form of peaks at grain boundaries, corresponding to large grain boundary bubbles. The evolving of molecular tritium distribution measured by SIMS during a typical thermal ramp release experiment shows precisely tritium diffusion from the centre of the grain to grain boundaries as the temperature increases: at the same time the remaining intragranular tritium inventory, given by the integral of the distribution

Paradoxes of photoconductive target and optical control of secondary ion yield

International Nuclear Information System (INIS)

Rokakh, A. G.; Matasov, M. D.

2010-01-01

This study of the photoconductivity of semiconductors, in particular, cadmium chalcogenides as materials for targets of vacuum image converters followed the path of overcoming paradoxes. The concepts developed by the classics of photoelectricity also help to understand the paradoxes of the new secondary-ion photoelectric effect, especially, its spectral characteristic. The optical channel of secondary ion yield control via a photoconductive target opens the way to a new branch of nanotechnology, i.e., optoionics.

Secondary Ion Mass Spectrometry SIMS XI

Science.gov (United States)

Gillen, G.; Lareau, R.; Bennett, J.; Stevie, F.

2003-05-01

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories: Isotopic SIMS Biological SIMS Semiconductor Characterization Techniques and Applications Ultra Shallow Depth Profiling Depth Profiling Fundamental/Modelling and Diffusion Sputter-Induced Topography Fundamentals of Molecular Desorption Organic Materials Practical TOF-SIMS Polyatomic Primary Ions Materials/Surface Analysis Postionization Instrumentation Geological SIMS Imaging Fundamentals of Sputtering Ion Formation and Cluster Formation Quantitative Analysis Environmental/Particle Characterization Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Large-scale freestanding nanometer-thick graphite pellicles for mass production of nanodevices beyond 10 nm.

Science.gov (United States)

Kim, Seul-Gi; Shin, Dong-Wook; Kim, Taesung; Kim, Sooyoung; Lee, Jung Hun; Lee, Chang Gu; Yang, Cheol-Woong; Lee, Sungjoo; Cho, Sang Jin; Jeon, Hwan Chul; Kim, Mun Ja; Kim, Byung-Gook; Yoo, Ji-Beom

2015-09-21

Extreme ultraviolet lithography (EUVL) has received much attention in the semiconductor industry as a promising candidate to extend dimensional scaling beyond 10 nm. We present a new pellicle material, nanometer-thick graphite film (NGF), which shows an extreme ultraviolet (EUV) transmission of 92% at a thickness of 18 nm. The maximum temperature induced by laser irradiation (λ = 800 nm) of 9.9 W cm(-2) was 267 °C, due to the high thermal conductivity of the NGF. The freestanding NGF was found to be chemically stable during annealing at 500 °C in a hydrogen environment. A 50 × 50 mm large area freestanding NGF was fabricated using the wet and dry transfer (WaDT) method. The NGF can be used as an EUVL pellicle for the mass production of nanodevices beyond 10 nm.

Aspects of quantitative secondary ion mass spectrometry

International Nuclear Information System (INIS)

Grauer, R.

1982-05-01

Parameters which have an influence on the formation of secondary ions by ion bombardment of a solid matrix are discussed. Quantitative SIMS-analysis with the help of calibration standards necessitates a stringent control of these parameters. This is particularly valid for the oxygen partial pressure which for metal analysis has to be maintained constant also under ultra high vacuum. The performance of the theoretical LTE-model (Local Thermal Equilibrium) using internal standards will be compared with the analysis with the help of external standards. The LTE-model does not satisfy the requirements for quantitative analysis. (Auth.)

Dependence of secondary ion emission current on the composition of beryllium-nickel alloys

International Nuclear Information System (INIS)

Pistryak, V.M.; Kozlov, V.F.; Tikhinskij, G.F.; Fogel', Ya.M.

1976-01-01

The dependence is studied of the secondary ions emission current on the composition of beryllium-nickel alloys. It is established that appearance of intermetallide phases in the Be-Ni alloys has no effect on the linear character of the secondary ions Ni + and Be + of emission current. The phase transformation from the solid solution to the compound Ni 5 Be 21 with a change in the alloys concentration is fixed by appearance of the secondary ion NiBe + emission. The limited solubility of nickel in solid beryllium at a temperature close to room temperature is determined to be equal to 1.3+-0.27 at%

A model based approach to reference-free straightness measurement at the Nanometer Comparator

Science.gov (United States)

Weichert, C.; Stavridis, M.; Walzel, M.; Elster, C.; Wiegmann, A.; Schulz, M.; Köning, R.; Flügge, J.; Tutsch, R.

2009-06-01

The Nanometer Comparator is the PTB reference length measuring machine for high precision calibrations of line scales and encoder systems. Up to now the Nanometer Comparator allows to measure the position of line structures in one dimension only. For high precision characterisations of masks, scales and incremental encoders, the measurement of the straightness of graduations is a requirement from emerging lithography techniques. Therefore the Nanometer Comparator will be equipped with an additional short range measurement system in the Y-direction, realized as a single path plane mirror interferometer and supposed to achieve sub-nm uncertainties. To compensate the topography of the Y-mirror, the Traceable Multi Sensor (TMS) method will be implemented to achieve a reference-free straightness measurement. Virtual experiments are used to estimate the lower accuracy limit and to determine the sensitive parameters. The virtual experiments contain the influence of the positioning devices, interferometer errors as well as non-perfect adjustment and fabrication of the machine geometry. The whole dynamic measurement process of the Nanometer Comparator including its influence on the TMS analysis, e.g. non-equally spaced measurement points, is simulated. We will present the results of these virtual experiments as well as the most relevant error sources for straightness measurement, incorporating the low uncertainties of the existing and planned measurement systems.

Secondary ions produced from condensed rare gas targets under highly charged MeV/amu heavy ion bombardment

International Nuclear Information System (INIS)

Tawara, H.; Tonuma, T.; Kumagai, H.; Matsuo, T.

1994-01-01

Secondary ions produced from condensed rare gas targets are observed under MeV/amu, highly charged, heavy ion impact. The intensities of the observed cluster ions decrease smoothly as the cluster sizes become large but show some discontinuities at particular sizes of cluster ions. This seems to be closely related to the stabilities of cluster ion structures. It is also noted that very few doubly charged or practically no triply/higher charged ions have been observed, in sharp contrast to that of some condensed molecular targets. (orig.)

Mapping the Diffusion Potential of a Reconstructed Au(111) Surface at Nanometer Scale with 2D Molecular Gas

International Nuclear Information System (INIS)

Yan Shi-Chao; Xie Nan; Gong Hui-Qi; Guo Yang; Shan Xin-Yan; Lu Xing-Hua; Sun Qian

2012-01-01

The adsorption and diffusion behaviors of benzene molecules on an Au(111) surface are investigated by low-temperature scanning tunneling microscopy. A herringbone surface reconstruction of the Au(111) surface is imaged with atomic resolution, and significantly different behaviors are observed for benzene molecules adsorbed on step edges and terraces. The electric field induced modification in the molecular diffusion potential is revealed with a 2D molecular gas model, and a new method is developed to map the diffusion potential over the reconstructed Au(111) surface at the nanometer scale. (condensed matter: structure, mechanical and thermal properties)

The effect of work function changes on secondary ion energy spectra

International Nuclear Information System (INIS)

Wittmaack, K.

1983-01-01

The effect of work function changes on experimental secondary ion energy spectra is discussed. In agreement with theory the measured ion intensities frequently exhibit an exponential work function dependence. However, the predicted velocity dependence is only observed at fairly high secondary ion energies. In the absence of a velocity dependence of the degree of ionization measured shifts of energy spectra reflect work function changes directly. Various instrumental problems are shown to aggravate a detailed comparison between experiment and theory. Significant artefacts must be expected if the extraction field is of the order of or less than the lateral field induced by a work function difference between the bombarded spot and the surrounding sample surface. (Auth.)

Ion-impact secondary emission in negative corona with photoionization

Directory of Open Access Journals (Sweden)

B. X. Lu

2017-03-01

Full Text Available A corona discharge measurement system and simulation model are presented to investigate the effects of photoionization and ion-impact secondary emission process in negative corona discharge. The simulation results obtained is shown good agreement with experimental observations. Distribution of electron density along the symmetry axis at three critical moments is shown and the role of photoionization in negative corona discharge is clearly explained. Moreover, the current pulses are also presented under different secondary emission coefficients and the effect of the secondary emission coefficient is discussed.

Probing Local Ionic Dynamics in Functional Oxides: From Nanometer to Atomic Scale

Science.gov (United States)

Kalinin, Sergei

2014-03-01

Vacancy-mediated electrochemical reactions in oxides underpin multiple applications ranging from electroresistive memories, to chemical sensors to energy conversion systems such as fuel cells. Understanding the functionality in these systems requires probing reversible (oxygen reduction/evolution reaction) and irreversible (cathode degradation and activation, formation of conductive filaments) electrochemical processes. In this talk, I summarize recent advances in probing and controlling these transformations locally on nanometer level using scanning probe microscopy. The localized tip concentrates the electric field in the nanometer scale volume of material, inducing local transition. Measured simultaneously electromechanical response (piezoresponse) or current (conductive AFM) provides the information on the bias-induced changes in material. Here, I illustrate how these methods can be extended to study local electrochemical transformations, including vacancy dynamics in oxides such as titanates, LaxSr1-xCoO3, BiFeO3, and YxZr1-xO2. The formation of electromechanical hysteresis loops and their bias-, temperature- and environment dependences provide insight into local electrochemical mechanisms. In materials such as lanthanum-strontium cobaltite, mapping both reversible vacancy motion and vacancy ordering and static deformation is possible, and can be corroborated by post mortem STEM/EELS studies. In ceria, a broad gamut of electrochemical behaviors is observed as a function of temperature and humidity. The possible strategies for elucidation ionic motion at the electroactive interfaces in oxides using high-resolution electron microscopy and combined ex-situ and in-situ STEM-SPM studies are discussed. In the second part of the talk, probing electrochemical phenomena on in-situ grown surfaces with atomic resolution is illustrated. I present an approach based on the multivariate statistical analysis of the coordination spheres of individual atoms to reveal

Proposal for secondary ion beams and update of data taking schedule for 2009-2013

CERN Document Server

Abgrall, N; Andrieu, B; Anticic, T; Antoniou, N; Argyriades, J; Asryan, A G; Baatar, B; Blondel, A; Blumer, J; Boldizsar, L; Bravar, A; Brzychczyk, J; Bunyatov, S A; Choi, K U; Christakoglou, P; Chung, P; Cleymans, J; Derkach, D A; Diakonos, F; Dominik, W; Dumarchez, J; Engel, R; Ereditato, A; Feofilov, G A; Ferrero, A; Fodor, Z; Gazdzicki, M; Golubeva, M; Grebieszkow, K; Guber, F; Hasegawa, T; Haungs, A; Hess, M; Igolkin, S; Ivanov, A S; Ivashkin, A; Kadija, K; Katrynska, N; Kielczewska, D; Kikola, D; Kim, J H; Kobayashi, T; Kolesnikov, V I; Kolev, D; Kolevatov, R S; Kondratiev, V P; Kurepin, A; Lacey, R; Laszlo, A; Lehmann, S; Lungwitz, B; Lyubushkin, V V; Maevskaya, A; Majka, Z; Malakhov, A I; Marchionni, A; Marcinek, A; Maris, I; Matveev, V; Melkumov, G L; Meregaglia, A; Messina, M; Meurer, C; Mijakowski, P; Mitrovski, M; Montaruli, T; Mrówczynski, St; Murphy, S; Nakadaira, T; Naumenko, P A; Nikolic, V; Nishikawa, K; Palczewski, T; Pálla, G; Panagiotou, A D; Peryt, W; Petridis, A; Planeta, R; Pluta, J; Popov, B A; Posiadala, M; Przewlocki, P; Rauch, W; Ravonel, M; Renfordt, R; Röhrich, D; Rondio, E; Rossi, B; Roth, M; Rubbia, A; Rybczynski, M; Sadovskii, A; Sakashita, K; Schuster, T; Sekiguchi, T; Seyboth, P; Shileev, K; Sissakian, A N; Skrzypczak, E; Slodkowski, M; Sorin, A S; Staszel, P; Stefanek, G; Stepaniak, J; Strabel, C; Ströbele, H; Susa, T; Szentpétery, I; Szuba, M; Taranenko, A; Tsenov, R; Ulrich, R; Unger, M; Vassiliou, M; Vechernin, V V; Vesztergombi, G; Wlodarczyk, Z; Wojtaszek, A; Yi, J G; Yoo, I K; CERN. Geneva. SPS and PS Experiments Committee; SPSC

2009-01-01

This document presents the proposal for secondary ion beams and the updated data taking schedule of the NA61 Collaboration. The modification of the original NA61 plans is necessary in order to reach compatibility between the current I-LHC and NA61 schedules. It assumes delivery of primary proton beam in 2009-2012 and of primary lead beam in 2011-2013. The primary lead beam will be fragmented into a secondary beam of lighter ions. The modified H2 beam line will serve as a fragment separator to produce the light ion species for NA61 data taking. The expected physics performance of the NA61 experiment with secondary ion beams will be sufficient to reach the primary NA61 physics goals.

Ultra-High Density Single Nanometer-Scale Anodic Alumina Nanofibers Fabricated by Pyrophosphoric Acid Anodizing

Science.gov (United States)

Kikuchi, Tatsuya; Nishinaga, Osamu; Nakajima, Daiki; Kawashima, Jun; Natsui, Shungo; Sakaguchi, Norihito; Suzuki, Ryosuke O.

2014-12-01

Anodic oxide fabricated by anodizing has been widely used for nanostructural engineering, but the nanomorphology is limited to only two oxides: anodic barrier and porous oxides. Therefore, the discovery of an additional anodic oxide with a unique nanofeature would expand the applicability of anodizing. Here we demonstrate the fabrication of a third-generation anodic oxide, specifically, anodic alumina nanofibers, by anodizing in a new electrolyte, pyrophosphoric acid. Ultra-high density single nanometer-scale anodic alumina nanofibers (1010 nanofibers/cm2) consisting of an amorphous, pure aluminum oxide were successfully fabricated via pyrophosphoric acid anodizing. The nanomorphologies of the anodic nanofibers can be controlled by the electrochemical conditions. Anodic tungsten oxide nanofibers can also be fabricated by pyrophosphoric acid anodizing. The aluminum surface covered by the anodic alumina nanofibers exhibited ultra-fast superhydrophilic behavior, with a contact angle of less than 1°, within 1 second. Such ultra-narrow nanofibers can be used for various nanoapplications including catalysts, wettability control, and electronic devices.

Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetry.

Science.gov (United States)

Villarrubia, J S; Tondare, V N; Vladár, A E

2016-01-01

The combination of scanning electron microscopy for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for nanometer-scale dimensional metrology in 3D. A method is described to test 3D photogrammetry software by the use of virtual samples-mathematical samples from which simulated images are made for use as inputs to the software under test. The virtual sample is constructed by wrapping a rough skin with any desired power spectral density around a smooth near-trapezoidal line with rounded top corners. Reconstruction is performed with images simulated from different angular viewpoints. The software's reconstructed 3D model is then compared to the known geometry of the virtual sample. Three commercial photogrammetry software packages were tested. Two of them produced results for line height and width that were within close to 1 nm of the correct values. All of the packages exhibited some difficulty in reconstructing details of the surface roughness.

Engineering polyelectrolyte multilayer structure at the nanometer length scale by tuning polymer solution conformation.

Science.gov (United States)

Boddohi, Soheil; Killingsworth, Christopher; Kipper, Matt

2008-03-01

Chitosan (a weak polycation) and heparin (a strong polyanion) are used to make polyelectrolyte multilayers (PEM). PEM thickness and composition are determined as a function of solution pH (4.6 to 5.8) and ionic strength (0.1 to 0.5 M). Over this range, increasing pH increases the PEM thickness; however, the sensitivity to changes in pH is a strong function of ionic strength. The PEM thickness data are correlated to the polymer conformation in solution. Polyelectrolyte conformation in solution is characterized by gel permeation chromatography (GPC). The highest sensitivity of PEM structure to pH is obtained at intermediate ionic strength. Different interactions govern the conformation and adsorption phenomena at low and high ionic strength, leading to reduced sensitivity to solution pH at extreme ionic strengths. The correspondence between PEM thickness and polymer solution conformation offers opportunities to tune polymer thin film structure at the nanometer length scale by controlling simple, reproducible processing conditions.

Monte Carlo modeling of ion beam induced secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Huh, U., E-mail: uhuh@vols.utk.edu [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Cho, W. [Electrical and Computer Engineering, University of Tennessee, Knoxville, TN 37996-2100 (United States); Joy, D.C. [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)

2016-09-15

Ion induced secondary electrons (iSE) can produce high-resolution images ranging from a few eV to 100 keV over a wide range of materials. The interpretation of such images requires knowledge of the secondary electron yields (iSE δ) for each of the elements and materials present and as a function of the incident beam energy. Experimental data for helium ions are currently limited to 40 elements and six compounds while other ions are not well represented. To overcome this limitation, we propose a simple procedure based on the comprehensive work of Berger et al. Here we show that between the energy range of 10–100 keV the Berger et al. data for elements and compounds can be accurately represented by a single universal curve. The agreement between the limited experimental data that is available and the predictive model is good, and has been found to provide reliable yield data for a wide range of elements and compounds. - Highlights: • The Universal ASTAR Yield Curve was derived from data recently published by NIST. • IONiSE incorporated with the Curve will predict iSE yield for elements and compounds. • This approach can also handle other ion beams by changing basic scattering profile.

Secondary ion emission from ultra-thin oxide layers bombarded by energetic (MeV) heavy ions: depth of origin and layer homogeneity

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.; Cabaud, B.; Fuchs, G.; Hoareau, A.; Treilleux, M.; Danel, J.S.

1993-09-01

The escape depth of the secondary ions resulting from electronic sputtering of fast heavy ions in inorganic thin films has been investigated. Chromium layers deposited onto SiO 2 substrate as well as SiO x layers deposited onto chromium substrate have been characterized by secondary ion emission mass spectrometry (SIMS) in combination with time-of-flight (TOF) mass analysis (also referred as HSF-SIMS). These crossed experiments lead to a value around 1 nm for SiO x layers and 0.5 nm for Cr layers. On the other hand, HSF-SIMS can be used to correlate the intensity of the secondary ion emission to the film coverage rate and (or) the morphology of particular films like those produced by Low Energy Cluster Beam Deposition (LECBD). Using Sb deposits, the non-linear relationship between ion emission and coverage is interpreted in terms of sputtering enhancement in the individual supported clusters. (author) 22 refs., 9 figs., 1 tab

Visualization of metallodrugs in single cells by secondary ion mass spectrometry imaging.

Science.gov (United States)

Wu, Kui; Jia, Feifei; Zheng, Wei; Luo, Qun; Zhao, Yao; Wang, Fuyi

2017-07-01

Secondary ion mass spectrometry, including nanoscale secondary ion mass spectrometry (NanoSIMS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS), has emerged as a powerful tool for biological imaging, especially for single cell imaging. SIMS imaging can provide information on subcellular distribution of endogenous and exogenous chemicals, including metallodrugs, from membrane through to cytoplasm and nucleus without labeling, and with high spatial resolution and chemical specificity. In this mini-review, we summarize recent progress in the field of SIMS imaging, particularly in the characterization of the subcellular distribution of metallodrugs. We anticipate that the SIMS imaging method will be widely applied to visualize subcellular distributions of drugs and drug candidates in single cells, exerting significant influence on early drug evaluation and metabolism in medicinal and pharmaceutical chemistry. Recent progress of SIMS applications in characterizing the subcellular distributions of metallodrugs was summarized.

The performance of a novel ion-counting nanodosimeter

CERN Document Server

Garty, G; Breskin, Amos; Chechik, R; Assaf, G; Orion, I; Bashkirov, V; Schulte, R; Grosswendt, B

2002-01-01

We present the performance of a novel device conceived for measuring minute energy deposits in a low-density gas, capable of operating in various radiation fields, including in an accelerator environment. The ion-counting nanodosimeter provides a precise measurement of the ionization distribution deposited within a small wall-less gas volume, modeling nanometer-scales of condensed matter, e.g. the DNA molecule. We describe the instrument and its data acquisition system. The results of systematic studies with low-energy alpha particles, protons and carbon ions are compared to model simulations; they demonstrate the capabilities and indicate the limitations of this novel technique.

Heavy-ion driver design and scaling

International Nuclear Information System (INIS)

Bieri, R.; Monsler, M.; Meier, W.; Stewart, L.

1992-01-01

Parametric models for scaling heavy-ion driver designs are described. Scaling of target performance and driver cost is done for driver parameters including driver energy, number of beams, type of superconductor used in focusing magnets, maximum magnetic field allowed at the superconducting windings, linear quadrupole array packing fraction mass, and ion charge state. The cumulative accelerator voltage and beam currents are determined from the Maschke limits on beam current for each choice of driver energy and post-acceleration pulse duration. The heavy-ion driver is optimized over the large available driver parameter space. Parametric studies and the choice of a base driver model are described in a companion paper

Study of vibrations and stabilization of linear collider final doublets at the sub-nanometer scale

International Nuclear Information System (INIS)

Bolzon, B.

2007-11-01

CLIC is one of the current projects of high energy linear colliders. Vertical beam sizes of 0.7 nm at the time of the collision and fast ground motion of a few nanometers impose an active stabilization of the final doublets at a fifth of nanometer above 4 Hz. The majority of my work concerned vibrations and active stabilization study of cantilever and slim beams in order to be representative of the final doublets of CLIC. In a first part, measured performances of different types of vibration sensors associated to an appropriate instrumentation showed that accurate measurements of ground motion are possible from 0.1 Hz up to 2000 Hz on a quiet site. Also, electrochemical sensors answering a priori the specifications of CLIC can be incorporated in the active stabilization at a fifth of nanometer. In a second part, an experimental and numerical study of beam vibrations enabled to validate the efficiency of the numerical prediction incorporated then in the simulation of the active stabilization. Also, a study of the impact of ground motion and of acoustic noise on beam vibrations showed that an active stabilization is necessary at least up to 1000 Hz. In a third part, results on the active stabilization of a beam at its two first resonances are shown down to amplitudes of a tenth of nanometer above 4 Hz by using in parallel a commercial system performing passive and active stabilization of the clamping. The last part is related to a study of a support for the final doublets of a linear collider prototype in phase of finalization, the ATF2 prototype. This work showed that relative motion between this support and the ground is below imposed tolerances (6 nm above 0.1 Hz) with appropriate boundary conditions. (author)

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Science.gov (United States)

Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

2018-02-01

A procedure has been established to define the interface position in depth profiles accurately when using secondary ion mass spectrometry and the negative secondary ions. The interface position varies strongly with the extent of the matrix effect and so depends on the secondary ion measured. Intensity profiles have been measured at both fluorenylmethyloxycarbonyl-uc(l)-pentafluorophenylalanine (FMOC) to Irganox 1010 and Irganox 1010 to FMOC interfaces for many secondary ions. These profiles show separations of the two interfaces that vary over some 10 nm depending on the secondary ion selected. The shapes of these profiles are strongly governed by matrix effects, slightly weakened by a long wavelength roughening. The matrix effects are separately measured using homogeneous, known mixtures of these two materials. Removal of the matrix and roughening effects give consistent compositional profiles for all ions that are described by an integrated exponentially modified Gaussian (EMG) profile. Use of a simple integrated Gaussian may lead to significant errors. The average interface positions in the compositional profiles are determined to standard uncertainties of 0.19 and 0.14 nm, respectively, using the integrated EMG function. Alternatively, and more simply, it is shown that interface positions and profiles may be deduced from data for several secondary ions with measured matrix factors by simply extrapolating the result to Ξ = 0. Care must be taken in quoting interface resolutions since those measured for predominantly Gaussian interfaces with Ξ above or below zero, without correction, appear significantly better than the true resolution.

Nanometer-scale mapping of irreversible electrochemical nucleation processes on solid Li-ion electrolytes

Science.gov (United States)

Kumar, Amit; Arruda, Thomas M.; Tselev, Alexander; Ivanov, Ilia N.; Lawton, Jamie S.; Zawodzinski, Thomas A.; Butyaev, Oleg; Zayats, Sergey; Jesse, Stephen; Kalinin, Sergei V.

2013-01-01

Electrochemical processes associated with changes in structure, connectivity or composition typically proceed via new phase nucleation with subsequent growth of nuclei. Understanding and controlling reactions requires the elucidation and control of nucleation mechanisms. However, factors controlling nucleation kinetics, including the interplay between local mechanical conditions, microstructure and local ionic profile remain inaccessible. Furthermore, the tendency of current probing techniques to interfere with the original microstructure prevents a systematic evaluation of the correlation between the microstructure and local electrochemical reactivity. In this work, the spatial variability of irreversible nucleation processes of Li on a Li-ion conductive glass-ceramics surface is studied with ~30 nm resolution. An increased nucleation rate at the boundaries between the crystalline AlPO4 phase and amorphous matrix is observed and attributed to Li segregation. This study opens a pathway for probing mechanisms at the level of single structural defects and elucidation of electrochemical activities in nanoscale volumes. PMID:23563856

Alpha spectrometry and secondary ion mass spectrometry of thorium

International Nuclear Information System (INIS)

Strisovska, Jana; Kuruc, Jozef; Galanda, Dusan; Matel, Lubomir; Velic, Dusan; Aranyosiova, Monika

2009-01-01

A sample of thorium content on steel discs was prepared by electrodeposition with a view to determining the natural thorium isotope. Thorium was determined by alpha spectrometry and by secondary ion mass spectrometry and the results of the two methods were compared

A scanning tunneling microscope with a scanning range from hundreds of micrometers down to nanometer resolution.

Science.gov (United States)

Kalkan, Fatih; Zaum, Christopher; Morgenstern, Karina

2012-10-01

A beetle type stage and a flexure scanning stage are combined to form a two stages scanning tunneling microscope (STM). It operates at room temperature in ultrahigh vacuum and is capable of scanning areas up to 300 μm × 450 μm down to resolution on the nanometer scale. This multi-scale STM has been designed and constructed in order to investigate prestructured metallic or semiconducting micro- and nano-structures in real space from atomic-sized structures up to the large-scale environment. The principle of the instrument is demonstrated on two different systems. Gallium nitride based micropillars demonstrate scan areas up to hundreds of micrometers; a Au(111) surface demonstrates nanometer resolution.

KINOFORM LENSES - TOWARD NANOMETER RESOLUTION.

Energy Technology Data Exchange (ETDEWEB)

STEIN, A.; EVANS-LUTTERODT, K.; TAYLOR, A.

2004-10-23

While hard x-rays have wavelengths in the nanometer and sub-nanometer range, the ability to focus them is limited by the quality of sources and optics, and not by the wavelength. A few options, including reflective (mirrors), diffractive (zone plates) and refractive (CRL's) are available, each with their own limitations. Here we present our work with kinoform lenses which are refractive lenses with all material causing redundant 2{pi} phase shifts removed to reduce the absorption problems inherently limiting the resolution of refractive lenses. By stacking kinoform lenses together, the effective numerical aperture, and thus the focusing resolution, can be increased. The present status of kinoform lens fabrication and testing at Brookhaven is presented as well as future plans toward achieving nanometer resolution.

Interdiffusion in nanometer-scale multilayers investigated by in situ low-angle x-ray diffraction

Science.gov (United States)

Wang, Wei-Hua; Bai, Hai Yang; Zhang, Ming; Zhao, J. H.; Zhang, X. Y.; Wang, W. K.

1999-04-01

An in situ low-angle x-ray diffraction technique is used to investigate interdiffusion phenomena in various metal-metal and metal-amorphous Si nanometer-scale compositionally modulated multilayers (ML's). The temperature-dependent interdiffusivities are obtained by accurately monitoring the decay of the first-order modulation peak as a function of annealing time. Activation enthalpies and preexponential factors for the interdiffusion in the Fe-Ti, Ag-Bi, Fe-Mo, Mo-Si, Ni-Si, Nb-Si, and Ag-Si ML's are determined. Activation enthalpies and preexponential factors for the interdiffusion in the ML's are very small compared with that in amorphous alloys and crystalline solids. The relation between the atomic-size difference and interdiffusion in the ML's are investigated. The observed interdiffusion characteristics are compared with that in amorphous alloys and crystalline α-Zr, α-Ti, and Si. The experimental results suggest that a collective atomic-jumping mechanism govern the interdiffusion in the ML's, the collective proposal involving 8-15 atoms moving between extended nonequilibrium defects by thermal activation. The role of the interdiffusion in the solid-state reaction in the ML's is also discussed.

Surface potential measurement of negative-ion-implanted insulators by analysing secondary electron energy distribution

International Nuclear Information System (INIS)

Toyota, Yoshitaka; Tsuji, Hiroshi; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki.

1994-01-01

The negative ion implantation method we have proposed is a noble technique which can reduce surface charging of isolated electrodes by a large margin. In this paper, the way to specify the surface potential of negative-ion-implanted insulators by the secondary electron energy analysis is described. The secondary electron energy distribution is obtained by a retarding field type energy analyzer. The result shows that the surface potential of fused quartz by negative-ion implantation (C - with the energy of 10 keV to 40 keV) is negatively charged by only several volts. This surface potential is extremely low compared with that by positive-ion implantation. Therefore, the negative-ion implantation is a very effective method for charge-up free implantation without charge compensation. (author)

Three-dimensional nanometer scale analyses of precipitate structures and local compositions in titanium aluminide engineering alloys

Science.gov (United States)

Gerstl, Stephan S. A.

Titanium aluminide (TiAl) alloys are among the fastest developing class of materials for use in high temperature structural applications. Their low density and high strength make them excellent candidates for both engine and airframe applications. Creep properties of TiAl alloys, however, have been a limiting factor in applying the material to a larger commercial market. In this research, nanometer scale compositional and structural analyses of several TiAl alloys, ranging from model Ti-Al-C ternary alloys to putative commercial alloys with 10 components are investigated utilizing three dimensional atom probe (3DAP) and transmission electron microscopies. Nanometer sized borides, silicides, and carbide precipitates are involved in strengthening TiAl alloys, however, chemical partitioning measurements reveal oxygen concentrations up to 14 at. % within the precipitate phases, resulting in the realization of oxycarbide formation contributing to the precipitation strengthening of TiAl alloys. The local compositions of lamellar microstructures and a variety of precipitates in the TiAl system, including boride, silicide, binary carbides, and intermetallic carbides are investigated. Chemical partitioning of the microalloying elements between the alpha2/gamma lamellar phases, and the precipitate/gamma-matrix phases are determined. Both W and Hf have been shown to exhibit a near interfacial excess of 0.26 and 0.35 atoms nm-2 respectively within ca. 7 nm of lamellar interfaces in a complex TiAl alloy. In the case of needle-shaped perovskite Ti3AlC carbide precipitates, periodic domain boundaries are observed 5.3+/-0.8 nm apart along their growth axis parallel to the TiAl[001] crystallographic direction with concomitant composition variations after 24 hrs. at 800°C.

Optoelectronic circuits in nanometer CMOS technology

CERN Document Server

Atef, Mohamed

2016-01-01

This book describes the newest implementations of integrated photodiodes fabricated in nanometer standard CMOS technologies. It also includes the required fundamentals, the state-of-the-art, and the design of high-performance laser drivers, transimpedance amplifiers, equalizers, and limiting amplifiers fabricated in nanometer CMOS technologies. This book shows the newest results for the performance of integrated optical receivers, laser drivers, modulator drivers and optical sensors in nanometer standard CMOS technologies. Nanometer CMOS technologies rapidly advanced, enabling the implementation of integrated optical receivers for high data rates of several Giga-bits per second and of high-pixel count optical imagers and sensors. In particular, low cost silicon CMOS optoelectronic integrated circuits became very attractive because they can be extensively applied to short-distance optical communications, such as local area network, chip-to-chip and board-to-board interconnects as well as to imaging and medical...

Wetting at the nanometer scale: effects of long-range forces and substrate heterogeneities

International Nuclear Information System (INIS)

Checco, Antonio

2003-01-01

Wetting phenomena on the nano-scale remain poorly understood in spite of their growing theoretical and practical interest. In this context, the present work aimed at studying partial wetting of nanometer-sized alkane droplets on 'model' surfaces build by self-assembly of organic monolayers. For this purpose a novel technique, based on 'noncontact' Atomic Force Microscopy (AFM), has been developed to image, with minimal artefacts, drops of adjustable size directly condensed on so- lid surfaces. We have thus shown that contact angle of alkanes, wetting a weakly heterogeneous, silanized substrate, noticeably decreases from its macroscopic value for droplets sizes in the submicron range. The line tension, arising in this case from purely dispersive long-range interactions between the liquid and the substrate, is theoretically too weak to be responsible for the observed effect. Therefore we have supposed that contact angle is affected by mesoscopic chemical heterogeneities of the substrate whenever the droplets size becomes sufficiently small. This scenario has been supported by numerical simulations based on a simplified model of the spatial distribution of surface defects. Similar experiments, performed on different substrates (monolayers made of alkane-thiols self-assembled on gold and of alkyl chains covalently bound onto a silicon surface), have also shown that wetting on small scales is strongly affected by minimal physical and chemical surface heterogeneities. Finally, to provide further examples of the potential of the above mentioned AFM technique, we have studied the wettability of nano-structured surfaces and the local wetting properties of hair. (author) [fr

Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

Energy Technology Data Exchange (ETDEWEB)

Aimoto, K. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)]. E-mail: dm053502@cc.seikei.ac.jp; Aoyagi, S. [Department of Regional Development, Faculty of Life and Environmental Science, Shimane University, 1060 Nishikawatsu-cho, Matsue-shi, Shimane 690-8504 (Japan); Kato, N. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan); Iida, N. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Yamamoto, A. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Kudo, M. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)

2006-07-30

We investigated the enhancement of the secondary ion intensity in the TOF-SIMS spectra obtained by Au{sup +} and Au{sub 3} {sup +} bombardment in comparison with Ga{sup +} excitation using polymer samples with different molecular weight distributions. Since the polymer samples used in this experiment have a wide molecular weight distribution, the advantages of the gold cluster primary ion source over monoatomic ion could accurately be evaluated. It was observed that the degree of fragmentation decreased by the usage of cluster primary ion beam compared with monoatomic ion beam, which was observed as a shift of the intensity distribution in the spectra. It was also found out that the mass effect of Au{sup +} and Ga{sup +} as monoatomic primary ion, resulted in about 10-60 times of enhancement for both samples with different molecular distributions. On the other hand, the Au{sub 3} {sup +} bombardment caused intensity enhancement about 100-2600 compared with Ga{sup +} bombardment, depending on the mass range of the detected secondary ion species. The cluster primary ion effect of Au{sub 3} {sup +}, compared with Au{sup +}, therefore, was estimated to be about 10-45.

Solid-state electrochemistry on the nanometer and atomic scales: the scanning probe microscopy approach

Science.gov (United States)

Strelcov, Evgheni; Yang, Sang Mo; Jesse, Stephen; Balke, Nina; Vasudevan, Rama K.; Kalinin, Sergei V.

2016-01-01

Energy technologies of the 21st century require understanding and precise control over ion transport and electrochemistry at all length scales – from single atoms to macroscopic devices. This short review provides a summary of recent works dedicated to methods of advanced scanning probe microscopy for probing electrochemical transformations in solids at the meso-, nano- and atomic scales. Discussion presents advantages and limitations of several techniques and a wealth of examples highlighting peculiarities of nanoscale electrochemistry. PMID:27146961

Storage of a lithium-ion secondary battery under micro-gravity conditions

Science.gov (United States)

Sone, Yoshitsugu; Ooto, Hiroki; Yamamoto, Masahiro; Eguro, Takashi; Sakai, Shigeru; Yoshida, Teiji; Takahashi, Keiji; Uno, Masatoshi; Hirose, Kazuyuki; Tajima, Michio; Kawaguchi, Jun'ichiro

'HAYABUSA' is a Japanese inter-planetary spacecraft built for the exploration of an asteroid named 'ITOKAWA.' The spacecraft is powered by a 13.2 Ah lithium-ion secondary battery. To realize maximum performance of the battery for long flight operation, the state-of-charge (SOC) of the battery was maintained at ca. 65% during storage, in case it is required for a loss of attitude control. The capacity of the battery was measured during flight operations. Along with the operation in orbit, a ground-test battery was discharged, and both results showed a good agreement. This result confirmed that the performance of the lithium-ion secondary battery stored under micro-gravity conditions is predictable using a ground-test battery.

A route to explosive large-scale magnetic reconnection in a super-ion-scale current sheet

Directory of Open Access Journals (Sweden)

K. G. Tanaka

2009-01-01

Full Text Available How to trigger magnetic reconnection is one of the most interesting and important problems in space plasma physics. Recently, electron temperature anisotropy (αeo=Te⊥/Te|| at the center of a current sheet and non-local effect of the lower-hybrid drift instability (LHDI that develops at the current sheet edges have attracted attention in this context. In addition to these effects, here we also study the effects of ion temperature anisotropy (αio=Ti⊥/Ti||. Electron anisotropy effects are known to be helpless in a current sheet whose thickness is of ion-scale. In this range of current sheet thickness, the LHDI effects are shown to weaken substantially with a small increase in thickness and the obtained saturation level is too low for a large-scale reconnection to be achieved. Then we investigate whether introduction of electron and ion temperature anisotropies in the initial stage would couple with the LHDI effects to revive quick triggering of large-scale reconnection in a super-ion-scale current sheet. The results are as follows. (1 The initial electron temperature anisotropy is consumed very quickly when a number of minuscule magnetic islands (each lateral length is 1.5~3 times the ion inertial length form. These minuscule islands do not coalesce into a large-scale island to enable large-scale reconnection. (2 The subsequent LHDI effects disturb the current sheet filled with the small islands. This makes the triggering time scale to be accelerated substantially but does not enhance the saturation level of reconnected flux. (3 When the ion temperature anisotropy is added, it survives through the small island formation stage and makes even quicker triggering to happen when the LHDI effects set-in. Furthermore the saturation level is seen to be elevated by a factor of ~2 and large-scale reconnection is achieved only in this case. Comparison with two-dimensional simulations that exclude the LHDI effects confirms that the saturation level

Surface characterization by energy distribution measurements of secondary electrons and of ion-induced electrons

International Nuclear Information System (INIS)

Bauer, H.E.; Seiler, H.

1988-01-01

Instruments for surface microanalysis (e.g. scanning electron or ion microprobes, emission electron or ion microscopes) use the current of emitted secondary electrons or of emitted ion-induced electrons for imaging of the analysed surface. These currents, integrating over all energies of the emitted low energy electrons, are however, not well suited to surface analytical purposes. On the contrary, the energy distribution of these electrons is extremely surface-sensitive with respect to shape, size, width, most probable energy, and cut-off energy. The energy distribution measurements were performed with a cylindrical mirror analyser and converted into N(E), if necessary. Presented are energy spectra of electrons released by electrons and argon ions of some contaminated and sputter cleaned metals, the change of the secondary electron energy distribution from oxidized aluminium to clean aluminium, and the change of the cut-off energy due to work function change of oxidized aluminium, and of a silver layer on a platinum sample. The energy distribution of the secondary electrons often shows detailed structures, probably due to low-energy Auger electrons, and is broader than the energy distribution of ion-induced electrons of the same object point. (author)

Thermal spike analysis of highly charged ion tracks

International Nuclear Information System (INIS)

Karlušić, M.; Jakšić, M.

2012-01-01

The irradiation of material using swift heavy ion or highly charged ion causes excitation of the electron subsystem at nanometer scale along the ion trajectory. According to the thermal spike model, energy deposited into the electron subsystem leads to temperature increase due to electron–phonon coupling. If ion-induced excitation is sufficiently intensive, then melting of the material can occur, and permanent damage (i.e., ion track) can be formed upon rapid cooling. We present an extension of the analytical thermal spike model of Szenes for the analysis of surface ion track produced after the impact of highly charged ion. By applying the model to existing experimental data, more than 60% of the potential energy of the highly charged ion was shown to be retained in the material during the impact and transformed into the energy of the thermal spike. This value is much higher than 20–40% of the transferred energy into the thermal spike by swift heavy ion. Thresholds for formation of highly charged ion track in different materials show uniform behavior depending only on few material parameters.

An Empirical Model for Build-Up of Sodium and Calcium Ions in Small Scale Reverse Osmosis

Directory of Open Access Journals (Sweden)

Subriyer Nasir

2011-05-01

Full Text Available A simple models for predicting build-up of solute on membrane surface were formulated in this paper. The experiments were conducted with secondary effluent, groundwater and simulated feed water in small-scale of RO with capacity of 2000 L/d. Feed water used in the experiments contained varying concentrations of sodium, calcium, combined sodium and calcium. In order to study the effect of sodium and calcium ions on membrane performance, experiments with ground water and secondary effluent wastewater were also performed. Build-up of salts on the membrane surface was calculated by measuring concentrations of sodium and calcium ions in feed water permeate and reject streams using Atomic Absorption Spectrophotometer (AAS. Multiple linear regression of natural logarithmic transformation was used to develop the model based on four main parameters that affect the build-up of solute in a small scale of RO namely applied pressure, permeate flux, membrane resistance, and feed concentration. Experimental data obtained in a small scale RO unit were used to develop the empirical model. The predicted values of theoretical build-up of sodium and calcium on membrane surface were found in agreement with experimental data. The deviation in the prediction of build-up of sodium and calcium were found to be 1.4 to 10.47 % and 1.12 to 4.46%, respectively.

Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

Energy Technology Data Exchange (ETDEWEB)

Thongkumkoon, P. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand); Prakrajang, K. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Faculty of Science, Maejo University, Chiang Mai 50290 (Thailand); Thopan, P.; Yaopromsiri, C. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Suwannakachorn, D. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand); Yu, L.D., E-mail: yuld@fnrf.science.cmu.ac.th [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)

2013-07-15

Highlights: ► Detected X-ray emission from metal, plastic and biological samples. ► Characteristic X-ray emission was detected from metal but not from non-metals. ► Low-energy ion bombarded bacteria held in different sample holders. ► Bacteria held in metal holder had higher mutation rate than in plastic holder. ► Ion-beam-induced X-ray from biological sample is not a basic mutation source. -- Abstract: Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation.

Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

International Nuclear Information System (INIS)

Thongkumkoon, P.; Prakrajang, K.; Thopan, P.; Yaopromsiri, C.; Suwannakachorn, D.; Yu, L.D.

2013-01-01

Highlights: ► Detected X-ray emission from metal, plastic and biological samples. ► Characteristic X-ray emission was detected from metal but not from non-metals. ► Low-energy ion bombarded bacteria held in different sample holders. ► Bacteria held in metal holder had higher mutation rate than in plastic holder. ► Ion-beam-induced X-ray from biological sample is not a basic mutation source. -- Abstract: Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation

Surface potential measurement of insulators in negative-ion implantation by secondary electron energy-peak shift

International Nuclear Information System (INIS)

Nagumo, Shoji; Toyota, Yoshitaka; Tsuji, Hiroshi; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1993-01-01

Negative-ion implantation is expected to realize charge-up free implantation. In this article, about a way to specify surface potential of negative-ion implanted insulator by secondary-electron-energy distribution, its principle and preliminary experimental results are described. By a measuring system with retarding field type energy analyzer, energy distribution of secondary electron from insulator of Fused Quartz in negative-carbon-ion implantation was measured. As a result the peak-shift of its energy distribution resulted according with the surface potential of insulator. It was found that surface potential of insulator is negatively charged by only several volts. Thus, negative-ion implanted insulator reduced its surface charge-up potential (without any electron supply). Therefore negative-ion implantation is considered to be much more effective method than conventional positive-ion implantation. (author)

Thermal and ultrasonic influence in the formation of nanometer scale hydroxyapatite bio-ceramic

Science.gov (United States)

Poinern, GJE; Brundavanam, R; Le, X Thi; Djordjevic, S; Prokic, M; Fawcett, D

2011-01-01

Hydroxyapatite (HAP) is a widely used biocompatible ceramic in many biomedical applications and devices. Currently nanometer-scale forms of HAP are being intensely investigated due to their close similarity to the inorganic mineral component of the natural bone matrix. In this study nano-HAP was prepared via a wet precipitation method using Ca(NO3)2 and KH2PO4 as the main reactants and NH4OH as the precipitator under ultrasonic irradiation. The Ca/P ratio was set at 1.67 and the pH was maintained at 9 during the synthesis process. The influence of the thermal treatment was investigated by using two thermal treatment processes to produce ultrafine nano-HAP powders. In the first heat treatment, a conventional radiant tube furnace was used to produce nano-particles with an average size of approximately 30 nm in diameter, while the second thermal treatment used a microwave-based technique to produce particles with an average diameter of 36 nm. The crystalline structure and morphology of all nanoparticle powders produced were investigated using X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), and Fourier transform infrared spectroscopy (FT-IR). Both thermal techniques effectively produced ultrafine powders with similar crystalline structure, morphology and particle sizes. PMID:22114473

Significant enhancement of magnetoresistance with the reduction of particle size in nanometer scale

Science.gov (United States)

Das, Kalipada; Dasgupta, P.; Poddar, A.; Das, I.

2016-01-01

The Physics of materials with large magnetoresistance (MR), defined as the percentage change of electrical resistance with the application of external magnetic field, has been an active field of research for quite some times. In addition to the fundamental interest, large MR has widespread application that includes the field of magnetic field sensor technology. New materials with large MR is interesting. However it is more appealing to vast scientific community if a method describe to achieve many fold enhancement of MR of already known materials. Our study on several manganite samples [La1−xCaxMnO3 (x = 0.52, 0.54, 0.55)] illustrates the method of significant enhancement of MR with the reduction of the particle size in nanometer scale. Our experimentally observed results are explained by considering model consisted of a charge ordered antiferromagnetic core and a shell having short range ferromagnetic correlation between the uncompensated surface spins in nanoscale regime. The ferromagnetic fractions obtained theoretically in the nanoparticles has been shown to be in the good agreement with the experimental results. The method of several orders of magnitude improvement of the magnetoresistive property will have enormous potential for magnetic field sensor technology. PMID:26837285

Secondary electrons as probe of preequilibrium stopping power of ions penetrating solids

International Nuclear Information System (INIS)

Kroneberger, K.; Rothard, H.; Koschar, P.; Lorenzen, P.; Groeneveld, K.O.; Clouvas, A.; Veje, E.; Kemmler, J.

1990-01-01

The passage of ions through solid media is accompanied by the emission of low energy secondary electrons. At high ion velocities v p (i.e. v p > 10 7 cm/s) the kinetic emission of electrons as a result of direct Coulomb interaction between the ion and the target electron is the dominant initial production mechanism. The energy lost by the ion and, thus, transferred to the electrons is known as electronic stopping power in the solid. Elastic and inelastic interactions of primary, liberated electrons on their way through the bulk and the surface of the solid modify strongly their original energy and angular distribution and, in particular, leads to the transfer of their energy to further, i.e. secondary electrons (SE), such that the main part of the deposited energy of the ion is eventually over transferred to SE. It is, therefore, suggestive to assume a proportionality between the electronic stopping power S sm-bullet of the ion and the total SE yield g, i.e. the number of electrons ejected per ion. Following Sternglass the authors consider schematically for kinetic SE emission contributions from two extreme cases: (a) SEs produced mostly isotropically with large impact parameter, associated with an escape depth L SE from the solid; (b) SEs produced mostly unisotropically in forward direction with small impact parameter (δ-electrons), associated with a transport length L δ

Secondary emission of negative ions and electrons resulting from electronic sputtering of cesium salts

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.

1993-04-01

Secondary ion emission of negative ions and electrons from alkali salts bombarded with high energy (9 MeV) Ar +++ is discussed. Quite different features are observed according to the nature of the salt investigated (halide or oxygenated). In the case of cesium, the electron emission from halides is characterized by intense electron showers (several hundred electrons) with narrow distributions in intensity and orientation. Conversely, for oxygenated salts, these distributions are broader, much less intense (one order of magnitude), and the ion emission exhibits an dissymmetry, which has never been observed for inorganics. This last result is interpreted in terms of radiolysis of the oxygenated salt, a process well documented for gamma-ray irradiation, but not yet reported in secondary ion emission. (author) 17 refs.; 10 figs

Statistical characterization of surface defects created by Ar ion bombardment of crystalline silicon

International Nuclear Information System (INIS)

Ghazisaeidi, M.; Freund, J. B.; Johnson, H. T.

2008-01-01

Ion bombardment of crystalline silicon targets induces pattern formation by the creation of mobile surface species that participate in forming nanometer-scale structures. The formation of these mobile species on a Si(001) surface, caused by sub-keV argon ion bombardment, is investigated through molecular dynamics simulation of Stillinger-Weber [Phys. Rev. B 31, 5262 (1985)] silicon. Specific criteria for identifying and classifying these mobile atoms based on their energy and coordination number are developed. The mobile species are categorized based on these criteria and their average concentrations are calculated

Optomechanical Design of a Hard X-ray Nanoprobe Instrument with Nanometer-Scale Active Vibration Control

International Nuclear Information System (INIS)

Shu, D.; Preissner, C.; Smolyanitskiy, A.; Maser, J.; Winarski, R.; Holt, M.; Lai, B.; Vogt, S.; Stephenson, G. B.

2007-01-01

We are developing a new hard x-ray nanoprobe instrument that is one of the centerpieces of the characterization facilities of the Center for Nanoscale Materials being constructed at Argonne National Laboratory. This new probe will cover an energy range of 3-30 keV with 30-nm spacial resolution. The system is designed to accommodate x-ray optics with a resolution limit of 10 nm, therefore, it requires staging of x-ray optics and specimens with a mechanical repeatability of better than 5 nm. Fast feedback for differential vibration control between the zone-plate x-ray optics and the sample holder has been implemented in the design using a digital-signal-processor-based real-time closed-loop feedback technique. A specially designed, custom-built laser Doppler displacement meter system provides two-dimensional differential displacement measurements with subnanometer resolution between the zone-plate x-ray optics and the sample holder. The optomechanical design of the instrument positioning stage system with nanometer-scale active vibration control is presented in this paper

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

Energy Technology Data Exchange (ETDEWEB)

Hirata, K., E-mail: k.hirata@aist.go.jp [National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565 (Japan); Saitoh, Y.; Chiba, A.; Yamada, K.; Narumi, K. [Takasaki Advanced Radiation Research Institute (TARRI), Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292 (Japan)

2013-11-01

Energetic cluster ions with energies of the order of sub MeV or greater were applied to time-of-flight (TOF) secondary ion (SI) mass spectrometry. This gave various advantages including enhancement of SIs required for chemical structure characterization and prevention of charging effects in SI mass spectra for organic targets. We report some characteristic features of TOF SI mass spectrometry using energetic cluster ion impact ionization and discuss two future applications of it.

Complementary Characterization of Cu(In,Ga)Se₂ Thin-Film Photovoltaic Cells Using Secondary Ion Mass Spectrometry, Auger Electron Spectroscopy, and Atom Probe Tomography.

Science.gov (United States)

Jang, Yun Jung; Lee, Jihye; Jeong, Jeung-Hyun; Lee, Kang-Bong; Kim, Donghwan; Lee, Yeonhee

2018-05-01

To enhance the conversion performance of solar cells, a quantitative and depth-resolved elemental analysis of photovoltaic thin films is required. In this study, we determined the average concentration of the major elements (Cu, In, Ga, and Se) in fabricated Cu(In,Ga)Se2 (CIGS) thin films, using inductively coupled plasma atomic emission spectroscopy, X-ray fluorescence, and wavelengthdispersive electron probe microanalysis. Depth profiling results for CIGS thin films with different cell efficiencies were obtained using secondary ion mass spectrometry and Auger electron spectroscopy to compare the atomic concentrations. Atom probe tomography, a characterization technique with sub-nanometer resolution, was used to obtain three-dimensional elemental mapping and the compositional distribution at the grain boundaries (GBs). GBs are identified by Na increment accompanied by Cu depletion and In enrichment. Segregation of Na atoms along the GB had a beneficial effect on cell performance. Comparative analyses of different CIGS absorber layers using various analytical techniques provide us with understanding of the compositional distributions and structures of high efficiency CIGS thin films in solar cells.

Secondary osteons scale allometrically in mammalian humerus and femur.

Science.gov (United States)

Felder, A A; Phillips, C; Cornish, H; Cooke, M; Hutchinson, J R; Doube, M

2017-11-01

Intra-cortical bone remodelling is a cell-driven process that replaces existing bone tissue with new bone tissue in the bone cortex, leaving behind histological features called secondary osteons. While the scaling of bone dimensions on a macroscopic scale is well known, less is known about how the spatial dimensions of secondary osteons vary in relation to the adult body size of the species. We measured the cross-sectional area of individual intact secondary osteons and their central Haversian canals in transverse sections from 40 stylopodal bones of 39 mammalian species (body mass 0.3-21 000 kg). Scaling analysis of our data shows that mean osteonal resorption area (negative allometry, exponent 0.23, R 2  0.54, p <0.005) and Haversian canal area (negative allometry, exponent 0.31, R 2  0.45, p <0.005) are significantly related to body mass, independent of phylogeny. This study is the most comprehensive of its kind to date, and allows us to describe overall trends in the scaling behaviour of secondary osteon dimensions, supporting the inference that the osteonal resorption area may be limited by the need to avoid fracture in smaller mammalian species, but the need to maintain osteocyte viability in larger mammalian species.

Simulation of Electrical Discharge Initiated by a Nanometer-Sized Probe in Atmospheric Conditions

International Nuclear Information System (INIS)

Chen Ran; Chen Chilai; Liu Youjiang; Wang Huanqin; Kong Deyi; Ma Yuan; Cada Michael; Brugger Jürgen

2013-01-01

In this paper, a two-dimensional nanometer scale tip-plate discharge model has been employed to study nanoscale electrical discharge in atmospheric conditions. The field strength distributions in a nanometer scale tip-to-plate electrode arrangement were calculated using the finite element analysis (FEA) method, and the influences of applied voltage amplitude and frequency as well as gas gap distance on the variation of effective discharge range (EDR) on the plate were also investigated and discussed. The simulation results show that the probe with a wide tip will cause a larger effective discharge range on the plate; the field strength in the gap is notably higher than that induced by the sharp tip probe; the effective discharge range will increase linearly with the rise of excitation voltage, and decrease nonlinearly with the rise of gap length. In addition, probe dimension, especially the width/height ratio, affects the effective discharge range in different manners. With the width/height ratio rising from 1:1 to 1:10, the effective discharge range will maintain stable when the excitation voltage is around 50 V. This will increase when the excitation voltage gets higher and decrease as the excitation voltage gets lower. Furthermore, when the gap length is 5 nm and the excitation voltage is below 20 V, the diameter of EDR in our simulation is about 150 nm, which is consistent with the experiment results reported by other research groups. Our work provides a preliminary understanding of nanometer scale discharges and establishes a predictive structure-behavior relationship

Resolving the three-dimensional microstructure of polymer electrolyte fuel cell electrodes using nanometer-scale X-ray computed tomography

Energy Technology Data Exchange (ETDEWEB)

Epting, William K.; Gelb, Jeff; Litster, Shawn

2012-02-08

The electrodes of a polymer electrolyte fuel cell (PEFC) are composite porous layers consisting of carbon and platinum nanoparticles and a polymer electrolyte binder. The proper composition and arrangement of these materials for fast reactant transport and high electrochemical activity is crucial to achieving high performance, long lifetimes, and low costs. Here, the microstructure of a PEFC electrode using nanometer-scale X-ray computed tomography (nano-CT) with a resolution of 50 nm is investigated. The nano-CT instrument obtains this resolution for the low-atomic-number catalyst support and binder using a combination of a Fresnel zone plate objective and Zernike phase contrast imaging. High-resolution, non-destructive imaging of the three-dimensional (3D) microstructures provides important new information on the size and form of the catalyst particle agglomerates and pore spaces. Transmission electron microscopy (TEM) and mercury intrusion porosimetry (MIP) is applied to evaluate the limits of the resolution and to verify the 3D reconstructions. The computational reconstructions and size distributions obtained with nano-CT can be used for evaluating electrode preparation, performing pore-scale simulations, and extracting effective morphological parameters for large-scale computational models. (Copyright copyright 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Experimental study on heavy-ion single event effect on nanometer DDR SRAM

International Nuclear Information System (INIS)

Luo Yinhong; Zhang Fengqi; Guo Hongxia; Zhou Hui; Wang Yanping; Zhang Keying

2013-01-01

Single event effect experimental study on 90 nm and 65 nm DDR SRAM were carried out, single event upset (SEU) cross section was discussed as a function of several parameters such as feature size, test pattern, incidence angle, supply voltage. Key influence factors and effect rule were analyzed. Feasibility of the current test method was discussed. Results indicate that, SEU cross section reduces as technologies scale down; the influence of test pattern and power supply on SEU cross section is small; tilt angle increases SEU cross section due to multiple upset increasement. The applicability of cosine tilt test method is correlative to ion species and linear energy transfer (LET) values. (authors)

Surface potential measurement of the insulator with secondary electron caused by negative ion implantation

International Nuclear Information System (INIS)

Tsuji, Hiroshi; Toyota, Yoshitaka; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1994-01-01

Ion implantation has the merit of the good controllability of implantation profile and low temperature process, and has been utilized for the impurity introduction in LSI production. However, positive ion implantation is carried out for insulator or insulated conductor substrates, their charged potential rises, which is a serious problem. As the requirement for them advanced, charge compensation method is not the effective means for resolving it. The negative ion implantation in which charging is little was proposed. When the experiment on the negative ion implantation into insulated conductors was carried out, it was verified that negative ion implantation is effective as the implantation process without charging. The method of determining the charged potential of insulators at the time of negative ion implantation by paying attention to the energy distribution of the secondary electrons emitted from substrates at the time was devised. The energy analyzer for measuring the energy distribution of secondary electrons was made, and the measurement of the charged potential of insulators was carried out. The principle of the measurement, the measuring system and the experimental results are reported. (K.I.)

Effect of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity, Saumyen; Banerjee, Soumyajyoti

2011-01-01

In this paper, we have investigated the role of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions. The equilibrium dust surface potential has been considered negative and hence primary and secondary electron temperatures are equal. Such plasma consists of three components: Boltzman distributed electrons, nonthermal ions and negatively charged inertial dust grains. From the linear dispersion relation, we have calculated the real frequency and growth rate of Jean's instability. Numerically, we have shown that for strong ion nonthermality Jean's mode is unstable. Growth of the instability reduces and the real part of the wave frequency increases with increasing secondary electron emission from dust grains. Hence, strong secondary electron emission suppresses Jean's instability in a complex plasma even when ion nonthermality is strong and equilibrium dust charge is negative.

Measurement of secondary particle production induced by particle therapy ion beams impinging on a PMMA target

Directory of Open Access Journals (Sweden)

Toppi M.

2016-01-01

Full Text Available Particle therapy is a technique that uses accelerated charged ions for cancer treatment and combines a high irradiation precision with a high biological effectiveness in killing tumor cells [1]. Informations about the secondary particles emitted in the interaction of an ion beam with the patient during a treatment can be of great interest in order to monitor the dose deposition. For this purpose an experiment at the HIT (Heidelberg Ion-Beam Therapy Center beam facility has been performed in order to measure fluxes and emission profiles of secondary particles produced in the interaction of therapeutic beams with a PMMA target. In this contribution some preliminary results about the emission profiles and the energy spectra of the detected secondaries will be presented.

Sub-nanometer-resolution imaging of peptide nanotubes in water using frequency modulation atomic force microscopy

Energy Technology Data Exchange (ETDEWEB)

Sugihara, Tomoki; Hayashi, Itsuho; Onishi, Hiroshi [Department of Chemistry, Graduate School of Science, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501 (Japan); Kimura, Kenjiro, E-mail: kimura@gold.kobe-u.ac.jp [Department of Chemistry, Graduate School of Science, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501 (Japan); Tamura, Atsuo [Department of Chemistry, Graduate School of Science, Kobe University, 1-1 Rokkodai-cho, Nada-ku, Kobe 657-8501 (Japan)

2013-06-20

Highlights: ► Peptide nanotubes were aligned on highly oriented pyrolytic graphite surface. ► We visualized sub-nanometer-scale structure on peptide nanotube surface in water. ► We observed hydration structure at a peptide nanotube/water interface. - Abstract: Peptide nanotubes are self-assembled fibrous materials composed of cyclic polypeptides. Recently, various aspects of peptide nanotubes have been studied, in particular the utility of different methods for making peptide nanotubes with diverse designed functions. In order to investigate the relationship between formation, function and stability, it is essential to analyze the precise structure of peptide nanotubes. Atomic-scale surface imaging in liquids was recently achieved using frequency modulation atomic force microscopy with improved force sensing. Here we provide a precise surface structural analysis of peptide nanotubes in water without crystallizing them obtained by imaging the nanotubes at the sub-nanometer scale in water. In addition, the local hydration structure around the peptide nanotubes was observed at the nanotube/water interface.

Mechanical design of multiple zone plates precision alignment apparatus for hard X-ray focusing in twenty-nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Shu, Deming; Liu, Jie; Gleber, Sophie C.; Vila-Comamala, Joan; Lai, Barry; Maser, Jorg M.; Roehrig, Christian; Wojcik, Michael J.; Vogt, Franz Stefan

2017-04-04

An enhanced mechanical design of multiple zone plates precision alignment apparatus for hard x-ray focusing in a twenty-nanometer scale is provided. The precision alignment apparatus includes a zone plate alignment base frame; a plurality of zone plates; and a plurality of zone plate holders, each said zone plate holder for mounting and aligning a respective zone plate for hard x-ray focusing. At least one respective positioning stage drives and positions each respective zone plate holder. Each respective positioning stage is mounted on the zone plate alignment base frame. A respective linkage component connects each respective positioning stage and the respective zone plate holder. The zone plate alignment base frame, each zone plate holder and each linkage component is formed of a selected material for providing thermal expansion stability and positioning stability for the precision alignment apparatus.

Secondary Electron Emission from Solid Hydrogen and Deuterium Resulting from Incidence of keV Electrons and Hydrogen Ions

DEFF Research Database (Denmark)

Sørensen, H.

1977-01-01

are small, in contrast to what is expected for insulating materials. One explanation is that the secondary electrons lose energy inside the target material by exciting vibrational and rotational states of the molecules, so that the number of electrons that may escape as secondary electrons is rather small....... The losses to molecular states will be largest for hydrogen, so that the SEE coefficients are smallest for solid hydrogen, as was observed. For the incidence of ions, the values of δ for the different molecular ions agree when the number of secondary electrons per incident atom is plotted versus the velocity...... or the stopping power of the incident particles. Measurements were also made for oblique incidence of H+ ions on solid deuterium for angles of incidence up to 75°. A correction could be made for the emission of secondary ions by also measuring the current calorimetrically. At largest energies, the angular...

Glass ceramic ZERODUR enabling nanometer precision

Science.gov (United States)

Jedamzik, Ralf; Kunisch, Clemens; Nieder, Johannes; Westerhoff, Thomas

2014-03-01

The IC Lithography roadmap foresees manufacturing of devices with critical dimension of digit nanometer asking for nanometer positioning accuracy requiring sub nanometer position measurement accuracy. The glass ceramic ZERODUR® is a well-established material in critical components of microlithography wafer stepper and offered with an extremely low coefficient of thermal expansion (CTE), the tightest tolerance available on market. SCHOTT is continuously improving manufacturing processes and it's method to measure and characterize the CTE behavior of ZERODUR® to full fill the ever tighter CTE specification for wafer stepper components. In this paper we present the ZERODUR® Lithography Roadmap on the CTE metrology and tolerance. Additionally, simulation calculations based on a physical model are presented predicting the long term CTE behavior of ZERODUR® components to optimize dimensional stability of precision positioning devices. CTE data of several low thermal expansion materials are compared regarding their temperature dependence between - 50°C and + 100°C. ZERODUR® TAILORED 22°C is full filling the tight CTE tolerance of +/- 10 ppb / K within the broadest temperature interval compared to all other materials of this investigation. The data presented in this paper explicitly demonstrates the capability of ZERODUR® to enable the nanometer precision required for future generation of lithography equipment and processes.

Study of the secondary negative ion emission of copper and several of its alloys by impact with Cs+ ions

International Nuclear Information System (INIS)

Vallerand, P.; Baril, M.

1977-01-01

Secondary ion emission studies have been undertaken using Cs + as the primary ion beam. A good vacuum (ca. 10 -8 torr) is needed to eliminate contamination by residual gases. Negative ion emission of pure copper is compared with its alloys. The thermodynamic equilibrium model of Andersen is discussed. For low element concentrations, the experimental data show enhancement in negative emission of P, Al, Fe, Sn, Ni, and attenuation for Zn, Pb. The order of magnitude of ionic efficiency S - for copper is evaluated at 10 -4 . (Auth.)

Application of secondary ion mass spectrometry (SIMS) to biological sample analysis

International Nuclear Information System (INIS)

Tamura, Hifumi

1990-01-01

Some major issues and problems related with the analysis of biological samples are discussed, focusing on demonstrated and possible solutions and the application of secondary ion mass spectrometry (SIMS) to investigation of the composition of biological samples. The effective use of secondary electrons in combination with negative ions is most practical for the analysis of biological samples. Regardless of whether positive or negative ions are used, the electric potential at the surface of a sample stays around a constant value because of the absense of the accumulation of electric charges at the surface, leading to almost complete avoidance of the charging of the biological sample. A soft tissue sample can suffer damage to the tissue or migration of atoms in removing water from the sample. Some processes including fixation and freeze drying are available to prevent this. The application of SIMS to biological analysis is still in the basic research stage and further studies will be required to develop practical methods. Possible areas of its application include medicine, pathology, toxicology, pharmacology, plant physiology and other areas related with marine life and marine contamination. (N.K.)

Jean’s instability in a complex plasma in presence of secondary electrons and nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity Saumyen

2013-01-01

In this paper we have investigated the effect of secondary electron emission and nonthermality of ion velocity distribution simultaneously on Jean’s instability in a complex plasma in presence of negatively charged dust grains. Primary and secondary electron temperatures are assumed to be equal. Thus plasma under consideration consists of Boltzmann distributed electrons, nonthermal ions and negatively charged dust grains. The dust grain component is modeled by continuity and momentum equations. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically it is found that for lower values of the nonthermal parameter Jean’s instability is higher for higher secondary electron emission whereas the effect of secondary electron emission on Jean’s instability becomes insignificant for higher values of the nonthermal parameter. (author)

Microporous carbon derived from polyaniline base as anode material for lithium ion secondary battery

International Nuclear Information System (INIS)

Xiang, Xiaoxia; Liu, Enhui; Huang, Zhengzheng; Shen, Haijie; Tian, Yingying; Xiao, Chengyi; Yang, Jingjing; Mao, Zhaohui

2011-01-01

Highlights: → Nitrogen-containing microporous carbon was prepared from polyaniline base by K 2 CO 3 activation, and used as anode material for lithium ion secondary battery. → K 2 CO 3 activation promotes the formation of amorphous and microporous structure. → High nitrogen content, and large surface area with micropores lead to strong intercalation between carbon and lithium ion, and thus improve the lithium storage capacity. -- Abstract: Microporous carbon with large surface area was prepared from polyaniline base using K 2 CO 3 as an activating agent. The physicochemical properties of the carbon were characterized by scanning electron microscope, X-ray diffraction, Brunauer-Emmett-Teller, elemental analyses and X-ray photoelectron spectroscopy measurement. The electrochemical properties of the microporous carbon as anode material in lithium ion secondary battery were evaluated. The first discharge capacity of the microporous carbon was 1108 mAh g -1 , whose first charge capacity was 624 mAh g -1 , with a coulombic efficiency of 56.3%. After 20 cycling tests, the microporous carbon retains a reversible capacity of 603 mAh g -1 at a current density of 100 mA g -1 . These results clearly demonstrated the potential role of microporous carbon as anode for high capacity lithium ion secondary battery.

Applications of simultaneous ion backscattering and ion-induced x-ray emission

International Nuclear Information System (INIS)

Musket, R.G.

1983-05-01

Simultaneous ion backscattering and ion-induced x-ray emission (E/sub x/greater than or equal to 300 eV) analyses have been performed using helium ions as probes of the first few hundred nanometers of various materials. These studies serve as a demonstration of the complementary nature of the two types of information obtained. Uncertainties associated with each of the individual techniques were reduced by performing both analyses. The principal advantages of simultaneous analyses over sequential analyses have been delineated

Optomechanical design of a hard x-ray nanoprobe instrument with active vibration control in nanometer scale

International Nuclear Information System (INIS)

Shu, D.; Maser, J.; Holt, M.; Winarski, R.; Preissner, C.; Smolyanitskiy, A.; Lai, B.; Vogt, S.; Stephenson, G.

2007-01-01

We are developing a new hard x-ray nanoprobe instrument that is one of the centerpieces of the characterization facilities of the Center for Nanoscale Materials being constructed at Argonne National Laboratory. This new probe will cover an energy range of 3-30 keV with 30-nm spatial resolution. The system is designed to accommodate x-ray optics with a resolution limit of 10 nm, therefore, it requires staging of x-ray optics and specimens with a mechanical repeatability of better than 5 nm. Fast feedback for differential vibration control between the zone-plate x-ray optics and the sample holder has been implemented in the design using a digital-signal-processor-based real-time closed-loop feedback technique. A specially designed, custom-built laser Doppler displacement meter system provides two-dimensional differential displacement measurements with subnanometer resolution between the zone-plate x-ray optics and the sample holder. The optomechanical design of the instrument positioning stage system with nanometer-scale active vibration control is presented in this paper.

A three-scale model for ionic solute transport in swelling clays incorporating ion-ion correlation effects

Science.gov (United States)

Le, Tien Dung; Moyne, Christian; Murad, Marcio A.

2015-01-01

A new three-scale model is proposed to describe the movement of ionic species of different valences in swelling clays characterized by three separate length scales (nano, micro, and macro) and two levels of porosity (nano- and micropores). At the finest (nano) scale the medium is treated as charged clay particles saturated by aqueous electrolyte solution containing monovalent and divalent ions forming the electrical double layer. A new constitutive law is constructed for the disjoining pressure based on the numerical resolution of non-local problem at the nanoscale which, in contrast to the Poisson-Boltzmann theory for point charge ions, is capable of capturing the short-range interactions between the ions due to their finite size. At the intermediate scale (microscale), the two-phase homogenized particle/electrolyte solution system is represented by swollen clay clusters (or aggregates) with the nanoscale disjoining pressure incorporated in a modified form of Terzaghi's effective principle. At the macroscale, the electro-chemical-mechanical couplings within clay clusters is homogenized with the ion transport in the bulk fluid lying in the micro pores. The resultant macroscopic picture is governed by a three-scale model wherein ion transport takes place in the bulk solution strongly coupled with the mechanics of the clay clusters which play the role of sources/sinks of mass to the bulk fluid associated with ion adsorption/desorption in the electrical double layer at the nanoscale. Within the context of the quasi-steady version of the multiscale model, wherein the electrolyte solution in the nanopores is assumed at instantaneous thermodynamic equilibrium with the bulk fluid in the micropores, we build-up numerically the ion-adsorption isotherms along with the constitutive law of the retardation coefficients of monovalent and divalent ions. In addition, the constitutive law for the macroscopic swelling pressure is reconstructed numerically showing patterns of

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range

International Nuclear Information System (INIS)

Vidovic, Z.

1997-06-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Fabrication of Micrometer- and Nanometer-Scale Polymer Structures by Visible Light Induced Dielectrophoresis (DEP Force

Directory of Open Access Journals (Sweden)

Wen J. Li

2011-12-01

Full Text Available We report in this paper a novel, inexpensive and flexible method for fabricating micrometer- and nanometer-scale three-dimensional (3D polymer structures using visible light sources instead of ultra-violet (UV light sources or lasers. This method also does not require the conventional micro-photolithographic technique (i.e., photolithographic masks for patterning and fabricating polymer structures such as hydrogels. The major materials and methods required for this novel fabrication technology are: (1 any cross-linked network of photoactive polymers (examples of fabricated poly(ethylene glycol (PEG-diacrylate hydrogel structures are shown in this paper; (2 an Optically-induced Dielectrophoresis (ODEP System which includes an “ODEP chip” (i.e., any chip that changes its surface conductivity when exposed to visible light, an optical microscope, a projector, and a computer; and (3 an animator software hosted on a computer that can generate virtual or dynamic patterns which can be projected onto the “ODEP chip” through the use of a projector and a condenser lens. Essentially, by placing a photosensitive polymer solution inside the microfluidic platform formed by the “ODEP chip” bonded to another substrate, and applying an alternating current (a.c. electrical potential across the polymer solution (typically ~20 Vp-p at 10 kHz, solid polymer micro/nano structures can then be formed on the “ODEP chip” surface when visible-light is projected onto the chip. The 2D lateral geometry (x and y dimensions and the thickness (height of the micro/nano structures are dictated by the image geometry of the visible light projected onto the “ODEP chip” and also the time duration of projection. Typically, after an image projection with intensity ranging from ~0.2 to 0.4 mW/cm2 for 10 s, ~200 nm high structures can be formed. In our current system, the thickness of these polymer structures can be controlled to form from ~200 nanometers to ~3

Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Miśnik, Maciej [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Gdańsk University of Technology (Poland); Konarski, Piotr [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Zawada, Aleksander [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Military University of Technology, Warszawa (Poland)

2016-03-15

We present results of the use of metal and metal oxide substrates that serve as collectors in ‘storing matter’, the quantitative technique of secondary ion mass spectrometry (SIMS). This technique allows separating the two base processes of secondary ion formation in SIMS. Namely, the process of ion sputtering is separated from the process of ionisation. The technique allows sputtering of the analysed sample and storing the sputtered material, with sub-monolayer coverage, onto a collector surface. Such deposits can be then analysed by SIMS, and as a result, the so called ‘matrix effects’ are significantly reduced. We perform deposition of the sputtered material onto Ti and Cu substrates and also onto metal oxide substrates as molybdenum, titanium, tin and indium oxides. The process of sputtering is carried within the same vacuum chamber where the SIMS analysis of the collected material is performed. For sputtering and SIMS analysis of the deposited material we use 5 keV Ar{sup +} beam of 500 nA. The presented results are obtained with the use of stationary collectors. Here we present a case study of chromium. The obtained results show that the molybdenum and titanium oxide substrates used as collectors increase useful yield by two orders, with respect to such pure elemental collectors as Cu and Ti. Here we define useful yield as a ratio of the number of detected secondary ions during SIMS analysis and the number of atoms sputtered during the deposition process.

Accurate and precise measurement of oxygen isotopic fractions and diffusion profiles by selective attenuation of secondary ions (SASI).

Science.gov (United States)

Téllez, Helena; Druce, John; Hong, Jong-Eun; Ishihara, Tatsumi; Kilner, John A

2015-03-03

The accuracy and precision of isotopic analysis in Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) relies on the appropriate reduction of the dead-time and detector saturation effects, especially when analyzing species with high ion yields or present in high concentrations. Conventional approaches to avoid these problems are based on Poisson dead-time correction and/or an overall decrease of the total secondary ion intensity by reducing the target current. This ultimately leads to poor detection limits for the minor isotopes and high uncertainties of the measured isotopic ratios. An alternative strategy consists of the attenuation of those specific secondary ions that saturate the detector, providing an effective extension of the linear dynamic range. In this work, the selective attenuation of secondary ion signals (SASI) approach is applied to the study of oxygen transport properties in electroceramic materials by isotopic labeling with stable (18)O tracer and ToF-SIMS depth profiling. The better analytical performance in terms of accuracy and precision allowed a more reliable determination of the oxygen surface exchange and diffusion coefficients while maintaining good mass resolution and limits of detection for other minor secondary ion species. This improvement is especially relevant to understand the ionic transport mechanisms and properties of solid materials, such as the parallel diffusion pathways (e.g., oxygen diffusion through bulk, grain boundary, or dislocations) in electroceramic materials with relevant applications in energy storage and conversion devices.

Carbon and nitrogen assimilation in deep subseafloor microbial cells

OpenAIRE

Morono, Yuki; Terada, Takeshi; Nishizawa, Manabu; Ito, Motoo; Hillion, François; Takahata, Naoto; Sano, Yuji; Inagaki, Fumio

2011-01-01

Remarkable numbers of microbial cells have been observed in global shallow to deep subseafloor sediments. Accumulating evidence indicates that deep and ancient sediments harbor living microbial life, where the flux of nutrients and energy are extremely low. However, their physiology and energy requirements remain largely unknown. We used stable isotope tracer incubation and nanometer-scale secondary ion MS to investigate the dynamics of carbon and nitrogen assimilation activities in individua...

Control of secondary electrons from ion beam impact using a positive potential electrode

Energy Technology Data Exchange (ETDEWEB)

Crowley, T. P., E-mail: tpcrowley@xanthotechnologies.com; Demers, D. R.; Fimognari, P. J. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams

NARCIS (Netherlands)

Castaldo, V.; Withagen, J.; Hagen, C.; Kruit, P.; Van Veldhoven, E.

2011-01-01

In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strongly dependent on the surface characteristics, in

Modification of graphene by ion irradiation

Energy Technology Data Exchange (ETDEWEB)

Bukowska, Hanna; Akcoeltekin, Sevilay; El Kharrazi, Mourad; Schleberger, Marika [Universitaet Duisburg-Essen, Fakultaet fuer Physik, Duisburg (Germany); Osmani, Orkhan [Universitaet Duisburg-Essen, Fakultaet fuer Physik, Duisburg (Germany); Technische Universitaet Kaiserslautern, Fachbereich Physik, Gottlieb-Daimler-Strasse, Gebaeude 47, 67663 Kaiserslautern (Germany)

2010-07-01

Ion irradiation can be used to modify surfaces on the nanometer scale. We investigate graphene on different insulator (SrTiO{sub 3}, TiO{sub 2}, and Al{sub 2}O{sub 3}) and semiconductor (SiO{sub 2}) substrates. The bombardment of those target surfaces with swift heavy ions under grazing angle of incidence creates chains of nanodots on the substrate and folds graphene to typical origami-like structures. The shape of the folded graphene seems to depend on the length of the tracks. The length can be controlled by the angle of incidence. From the analysis of atomic force microscopy measurements, we classify the different types of modifications, with the aim to determine the relationship between chain length and origami shape. Further more we want to develop a theoretical understanding of the physical processes leading to the folding.

Compositional changes of human hair melanin resulting from bleach treatment investigated by nanoscale secondary ion mass spectrometry.

Science.gov (United States)

Kojima, Toru; Yamada, Hiromi; Isobe, Mitsuru; Yamamoto, Toshihiko; Takeuchi, Miyuki; Aoki, Dan; Matsushita, Yasuyuki; Fukushima, Kazuhiko

2014-11-01

It is important to understand the influence of bleach treatment on human hair because it is one of the most important chemical treatments in hair cosmetic processes. A comparison of the elemental composition of melanin between virgin hair and bleached hair would provide important information about the structural changes of melanin. To investigate the elemental composition of melanin granules in virgin black hair and bleached hair, these hair cross-sections are analyzed by using a nanoscale secondary ion mass spectrometry (NanoSIMS). The virgin black hair and bleached hair samples were embedded in resin and smooth hair cross-sections were obtained using an ultramicrotome. NanoSIMS measurements were performed using a Cs(+) primary ion beam to detect negative secondary ions. More intensive (16) O(-) ions were detected from the melanin granules of bleached hair than from those of virgin black hair in NanoSIMS (16) O(-) ion image. In addition, it was indicated that (16) O(-) ion intensity and (16) O(-) /(12) C(14) N(-) ion intensity ratio of melanin granules in bleached hair were higher than those in virgin black hair. Nanoscale secondary ion mass spectrometry analysis of the cross-sections of virgin black hair and bleached hair indicated that the oxygen content in melanin granules was increased by bleach treatment. © 2014 John Wiley & Sons A/S. Published by John Wiley & Sons Ltd.

The Adsorption of n-Octanohydroxamate Collector on Cu and Fe Oxide Minerals Investigated by Static Secondary Ion Mass Spectrometry

Directory of Open Access Journals (Sweden)

Alan N. Buckley

2012-12-01

Full Text Available The feasibility of investigating the adsorption of n-octanohydroxamate collector on copper and iron oxide minerals with static secondary ion mass spectrometry has been assessed. Secondary ion mass spectra were determined for abraded surfaces of air-exposed copper metal, malachite, pseudomalachite and magnetite that had been conditioned in aqueous potassium hydrogen n-octanohydroxamate solution, as well as for the corresponding bulk CuII and FeIII complexes. In each case, the chemical species present at the solid/vacuum interface of a similarly prepared surface were established by X-ray photoelectron spectroscopy. The most abundant positive and negative metal-containing fragment ions identified for the bulk complexes were also found to be diagnostic secondary ions for the collector adsorbed on the oxide surfaces. The relative abundances of those diagnostic ions varied with, and could be rationalised by, the monolayer or multilayer coverage of the adsorbed collector. However, the precise mass values for the diagnostic ions were not able to corroborate the different bonding in the copper and iron hydroxamate systems that had been deduced from photoelectron and vibrational spectra. Parent secondary ions were able to provide supporting information on the co-adsorption of hydroxamic acid at each conditioned surface.

ION-SCALE TURBULENCE IN THE INNER HELIOSPHERE: RADIAL DEPENDENCE

Energy Technology Data Exchange (ETDEWEB)

Comisel, H.; Motschmann, U.; Büchner, J.; Narita, Y.; Nariyuki, Y. [University of Toyama, Faculty of Human Development, 3190, Gofuku, Toyama, 930-8555 (Japan)

2015-10-20

The evolution of the ion-scale plasma turbulence in the inner heliosphere is studied by associating the plasma parameters for hybrid-code turbulence simulations to the radial distance from the Sun via a Solar wind model based mapping procedure. Using a mapping based on a one-dimensional solar wind expansion model, the resulting ion-kinetic scale turbulence is related to the solar wind distance from the Sun. For this purpose the mapping is carried out for various values of ion beta that correspond to the heliocentric distance. It is shown that the relevant normal modes such as ion cyclotron and ion Bernstein modes will occur first at radial distances of about 0.2–0.3 AU, i.e., near the Mercury orbit. This finding can be used as a reference, a prediction to guide the in situ measurements to be performed by the upcoming Solar Orbiter and Solar Probe Plus missions. Furthermore, a radial dependence of the wave-vector anisotropy was obtained. For astrophysical objects this means that the spatial scales of filamentary structures in interstellar media or astrophysical jets can be predicted for photometric observations.

Magnetic insulation of secondary electrons in plasma source ion implantation

International Nuclear Information System (INIS)

Rej, D.J.; Wood, B.P.; Faehl, R.J.; Fleischmann, H.H.

1993-01-01

The uncontrolled loss of accelerated secondary electrons in plasma source ion implantation (PSII) can significantly reduce system efficiency and poses a potential x-ray hazard. This loss might be reduced by a magnetic field applied near the workpiece. The concept of magnetically-insulated PSII is proposed, in which secondary electrons are trapped to form a virtual cathode layer near the workpiece surface where the local electric field is essentially eliminated. Subsequent electrons that are emitted can then be reabsorbed by the workpiece. Estimates of anomalous electron transport from microinstabilities are made. Insight into the process is gained with multi-dimensional particle-in-cell simulations

SIMS diagnostics of nanometer semiconductor structures with the use of cesium ions

International Nuclear Information System (INIS)

Pustovit, A.N.; Vyatkin, A.F.

2006-01-01

The modernization of cesium ion source was carried out to increase the lifetime, the power range of primary ions and temporary stability of primary ion beam. The elements depth profiles obtained with the help of primary cesium ions and primary iodine ions are in good agreement with transmission electron microscopy data [ru

Effect of Weakly Nonthermal Ion Velocity Distribution on Jeans Instability in a Complex Plasma in Presence of Secondary Electrons

International Nuclear Information System (INIS)

Sarkar, S.; Maity, S.

2013-01-01

In this paper we have investigated the effect of weak nonthermality of ion velocity distribution on Jean’s instability in a complex plasma in presence of secondary electrons and negatively charged dust grains. The primary and secondary electron temperatures are assumed equal. Thus plasma under consideration consists of three components: Boltzman distributed electrons, non-thermal ions and negatively charged inertial dust grains. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically we have found that secondary electron emission destabilizes Jean’s mode when ion nonthermality is weak. (author)

Length scale of secondary stresses in fracture and fatigue

International Nuclear Information System (INIS)

Dong, P.

2008-01-01

In an attempt to provide a consistent framework for the analysis and treatment of secondary stresses associated with welding and thermal loading in the context of fracture mechanics, this paper starts with an effective stress characterization procedure by introducing a length-scale concept. With it, a traction-based stress separation procedure is then presented to provide a consistent characterization of stresses from various sources based on their length scale. Their relative contributions to fracture driving force are then quantified in terms of their characteristic length scales. Special attention is given to the implications of the length-scale argument on both analysis and treatment of welding residual stresses in fracture assessment. A series of examples is provided to demonstrate how the present developments can be applied for treating not only secondary stresses but also externally applied stresses, as well as their combined effects on the structural integrity of engineering components

Sensitive SERS detection at the single-particle level based on nanometer-separated mushroom-shaped plasmonic dimers

Science.gov (United States)

Xiang, Quan; Li, Zhiqin; Zheng, Mengjie; Liu, Qing; Chen, Yiqin; Yang, Lan; Jiang, Tian; Duan, Huigao

2018-03-01

Elevated metallic nanostructures with nanogaps (film deposition. By controlling the initial size of nanogaps in resist structures and the following deposited film thickness, metallic nanogaps could be tuned at the sub-10 nm scale with single-digit nanometer precision. Both experimental and simulated results revealed that gold dimer on mushroom-shaped pillars have the capability to achieve higher SERS enhancement factor comparing to those plasmonic dimers on cylindrical pillars or on a common SiO2/Si substrate, implying that the nanometer-gapped elevated dimer is an ideal platform to achieve the highest possible field enhancement for various plasmonic applications.

Study of the secondary negative ion emission of copper and several of its alloys by impact with Cs/sup +/ ions

Energy Technology Data Exchange (ETDEWEB)

Vallerand, P; Baril, M [Laval Univ., Quebec City (Canada). Dept. de Physique

1977-07-01

Secondary ion emission studies have been undertaken using Cs/sup +/ as the primary ion beam. A good vacuum (ca. 10/sup -8/ torr) is needed to eliminate contamination by residual gases. Negative ion emission of pure copper is compared with its alloys. The thermodynamic equilibrium model of Andersen is discussed. For low element concentrations, the experimental data show enhancement in negative emission of P, Al, Fe, Sn, Ni, and attenuation for Zn, Pb. The order of magnitude of ionic efficiency S/sup -/ for copper is evaluated at 10/sup -4/.

Heavy-ion induced secondary electron emission from Mg, Al, and Si partially covered with oxygen

International Nuclear Information System (INIS)

Weng, J; Veje, E.

1984-01-01

We have bombarded Mg, Al, and Si with 80 keV Ar + ions and measured the secondary electron emission yields at projectile incidence angles from 0 0 to 85 0 , with oxygen present at the target as well as under UHV conditions. The total secondary electron emission yields are found to depend fairly much on the amount of oxygen present. The three elements studied show relatively large individual variations. For all three elements, and with as well as without oxygen present, the relative secondary electron emission yield is observed to vary as 1/cos v, where v is the angle of incidence of the projectiles. This seems to indicate that the secondary electron production is initiated uniformly along the projectile path in the solid, in a region close to the surface. The results are discussed, and it is tentatively suggested, that the increase in secondary electron emission, caused by the presence of oxygen, originates from neutralization of sputtered oxygen, which initially is sitting as O 2- ions. (orig.)

Application of secondary ion emission to impurity control in tokamaks

International Nuclear Information System (INIS)

Krauss, A.R.; Gruen, D.M.

1979-01-01

The extent to which high Z impurities enter the plasma of a magnetic confinement fusion device depends on the kinetic energy, angle of emission, and very importantly, the charge state of the ejected material. We have been studying both the fundamental process of secondary ion emission and possible techniques for producing surfaces which give rise to high ion fractions during sputtering, with a view to assessing the potential of this approach to impurity control in tokamaks. By carefully choosing materials exposed to fusion plasmas and by properly modifying the surface it may be possible to insure that nearly all the impurities are ejected as ions. As long as certain gas blanket configurations are avoided and especially if a divertor is used, it should then be possible to remove the impurities before they reach the plasma. The relative merits of a variety of materials are considered with regard to this application

New experiments in organic, fast-atom-bomdardment, and secondary-ion mass spectrometry

International Nuclear Information System (INIS)

DiDonato, G.C.

1987-01-01

The goal of research presented in this dissertation is the creative use of new ionization and instrumental techniques in mass spectrometry. This goal manifests itself in three areas of mass spectrometry. In the first portion, modern, state-of-the-art instrumentation and new experiments were used to re-examine the mass spectra of transition-metal acetates and acetylacetonates. High resolution, chemical ionization, negative chemical ionization, and extended-mass-range mass spectrometry uncovered a wealth of new gas-phase ionic species. Energy-resolved mass spectrometry/mass spectrometry was applied to the characterization of molecular and fragment ion first-row transition-metal acetylacetonates, and comprises the second portion of the thesis. Studies in fast-atom-bombardment mass spectrometry are the subject of the third portion of the dissertation. Since fast-atom bombardment samples a liquid matrix, absolute and relative abundances of sputtered secondary ions are influenced by solution chemistry. The design and construction of an imaging secondary-ion mass spectrometer is the subject of the final portion of the thesis. This instrument provides for direct mass-spectrometric analysis of thin-layer and paper chromatograms and electrophoretograms

Proceedings of the RCNP cascade project workshop 'heavy ion secondary beam course'

International Nuclear Information System (INIS)

1991-10-01

In the Research Center for Nuclear Physics (RCNP), Osaka University, as one of the experimental facilities utilizing the heavy ion beam from the ring cyclotron, the construction of the heavy ion secondary beam course has been in progress. This course can supply the unstable nuclei produced by a heavy ion reaction as a secondary beam, and is expected to become the powerful experimental facility for elucidating the condition of atomic nuclei in the extreme condition and their reaction mode. At present, the arrangement is advanced aiming at the utilization from the end of fiscal year 1991. Toward the start of joint utilization experiment, in order to examine the expected physics, concrete experimental plan and the preparation plan accompanying them, the workshop including the introduction of the course was held. On December 15, 1990, the workshop with the theme on the nuclear reaction by unstable nucleus beam was held, and on January 26, 1991, that with the theme on the spectroscopy of unstable nuclei was held. In each meeting, there were more than 20 participants. In this report, the gists of 18 papers are collected. (K.I.)

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

OpenAIRE

Moritomo, Yutaka; Goto, Kensuke; Shibata, Takayuki

2015-01-01

Manganese hexacyanoferrate (Mn-PBA) is a promising cathode material forsodium-ion secondary battery (SIB) with high average voltage (=3.4 V) against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grown)to 15 C (glucose-treated). Our observation suggests that thermal tr...

Optical properties of (nanometer MCM-41)-(malachite green) composite materials

International Nuclear Information System (INIS)

Li Xiaodong; Zhai Qingzhou; Zou Mingqiang

2010-01-01

Nanosized materials loaded with organic dyes are of interest with respect to novel optical applications. The optical properties of malachite green (MG) in MCM-41 are considerably influenced by the limited nanoporous channels of nanometer MCM-41. Nanometer MCM-41 was synthesized by tetraethyl orthosilicate (TEOS) as the source of silica and cetyltrimethylammonium bromide (CTMAB) as the template. The liquid-phase grafting method has been employed for incorporation of the malachite green molecules into the channels of nanometer MCM-41. A comparative study has been carried out on the adsorption of the malachite green into modified MCM-41 and unmodified MCM-41. The modified MCM-41 was synthesized using a silylation reagent, trimethychlorosilane (TMSCl), which functionalized the surface of nanometer MCM-41 for proper host-guest interaction. The prepared (nanometer MCM-41)-MG samples have been studied by powder X-ray diffraction (XRD), Fourier transform infrared (FT-IR) spectroscopy, low-temperature nitrogen adsorption-desorption technique at 77 K, Raman spectra and luminescence studies. In the prepared (nanometer MCM-41)-MG composite materials, the frameworks of the host molecular sieve were kept intact and the MG located inside the pores of MCM-41. Compared with the MG, it is found that the prepared composite materials perform a considerable luminescence. The excitation and emission spectra of MG in both modified MCM-41 and unmodified MCM-41 were examined to explore the structural effects on the optical properties of MG. The results of luminescence spectra indicated that the MG molecules existed in monomer form within MCM-41. However, the luminescent intensity of MG incorporated in the modified MCM-41 are higher than that of MG encapsulated in unmodified MCM-41, which may be due to the anchored methyl groups on the channels of the nanometer MCM-41 and the strong host-guest interactions. The steric effect from the pore size of the host materials is significant. Raman

Dispersion effect and auto-reconditioning performance of nanometer ...

Indian Academy of Sciences (India)

This paper reported on dispersion effect and dispersing techniques of nanometer WS2 particles in the green lubricant concocted by us. And it also researched on auto-reconditioning performance of nanometer WS2 particles to the abrasive surfaces of steel ball from four-ball tribology test and piston ring from engine ...

Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors

KAUST Repository

Wang, Lei

2011-06-01

We report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystallineSr0.6K0.4Fe2As2superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (Jc) of polycrystalline samples with respect to that of bicrystal films.

Secondary emission from a CuBe target due to bombardment with parent and fragment ions of ammonia and phosphine

International Nuclear Information System (INIS)

Maerk, T.D.

1977-01-01

The secondary electron emission of the first dynode of a CuBe alloy sixteen dynode electron multiplier has been studied in the course of electron impact ionization studies of ammonia and phosphine. Relative secondary electron emission coefficients have been obtained for the singly and doubly charged parent and fragment ions of ammonia, ammonia-d 3 , phosphine and phosphine-d 3 for kinetic energies of 5,25 and 10,5 keV. It has been found, that in general deuterated ions have smaller γ coefficients, that ammonia ions have larger γ coefficients than corresponding phosphine ions, and that the γ coefficients increase with the complexity of the ion under study. (Auth.)

Modulation of Magnetic Properties at the Nanometer Scale in Continuously Graded Ferromagnets

Directory of Open Access Journals (Sweden)

Lorenzo Fallarino

2018-02-01

Full Text Available Ferromagnetic alloy materials with designed composition depth profiles provide an efficient route for the control of magnetism at the nanometer length scale. In this regard, cobalt-chromium and cobalt-ruthenium alloys constitute powerful model systems. They exhibit easy-to-tune magnetic properties such as saturation magnetization MS and Curie temperature TC while preserving their crystalline structure over a wide composition range. In order to demonstrate this materials design potential, we have grown a series of graded Co1−xCrx and Co1−wRuw (10 1 ¯ 0 epitaxial thin films, with x and w following predefined concentration profiles. Structural analysis measurements verify the epitaxial nature and crystallographic quality of our entire sample sets, which were designed to exhibit in-plane c-axis orientation and thus a magnetic in-plane easy axis to achieve suppression of magnetostatic domain generation. Temperature and field-dependent magnetic depth profiles have been measured by means of polarized neutron reflectometry. In both investigated structures, TC and MS are found to vary as a function of depth in accordance with the predefined compositional depth profiles. Our Co1−wRuw sample structures, which exhibit very steep material gradients, allow us to determine the localization limit for compositionally graded materials, which we find to be of the order of 1 nm. The Co1−xCrx systems show the expected U-shaped TC and MS depth profiles, for which these specific samples were designed. The corresponding temperature dependent magnetization profile is then utilized to control the coupling along the film depth, which even allows for a sharp onset of decoupling of top and bottom sample parts at elevated temperatures.

Secondary electron/reflected particle coincidence studies during slow highly charged ion-surface interactions

Energy Technology Data Exchange (ETDEWEB)

McGrath, C.T.; Szilagyi, Z.; Shah, M.B.; McCullough, R.W. [Queen' s Univ., Belfast, Northern Ireland (United Kingdom); Woolsey, J.M. [Stirling Univ. (United Kingdom). DBMS; Trassl, R.; Salzborn, E. [Giessen Univ. (Germany). Inst. fuer Kernphysik

2001-07-01

We have measured the secondary electron emission statistics (ES) for 5 keV N{sup q+} (q = 1-4) ions incident at 10 on polycrystalline aluminium, in coincidence with specularly reflected N{sup 0}. In this arrangement the kinetic contribution to secondary electron emission is minimised. The experimental data shows that the coincident electron yield, {gamma}, increases linearly with incident ion charge state. The kinetic emission contribution has also been determined from this data. The ES due to 2 and 4 keV He{sup 2+} impact on polycrystalline aluminium in coincidence with specularly reflected He{sup +} and He{sup 0} have also been determined. The process He{sup 2+} {yields} He{sup 0} yields a larger {gamma} value than the process He{sup 2+} {yields} He{sup +}. (orig.)

Imaging Live Cells at the Nanometer-Scale with Single-Molecule Microscopy: Obstacles and Achievements in Experiment Optimization for Microbiology

Science.gov (United States)

Haas, Beth L.; Matson, Jyl S.; DiRita, Victor J.; Biteen, Julie S.

2015-01-01

Single-molecule fluorescence microscopy enables biological investigations inside living cells to achieve millisecond- and nanometer-scale resolution. Although single-molecule-based methods are becoming increasingly accessible to non-experts, optimizing new single-molecule experiments can be challenging, in particular when super-resolution imaging and tracking are applied to live cells. In this review, we summarize common obstacles to live-cell single-molecule microscopy and describe the methods we have developed and applied to overcome these challenges in live bacteria. We examine the choice of fluorophore and labeling scheme, approaches to achieving single-molecule levels of fluorescence, considerations for maintaining cell viability, and strategies for detecting single-molecule signals in the presence of noise and sample drift. We also discuss methods for analyzing single-molecule trajectories and the challenges presented by the finite size of a bacterial cell and the curvature of the bacterial membrane. PMID:25123183

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

Directory of Open Access Journals (Sweden)

G. Fubiani

2008-01-01

Full Text Available The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses. The resulting secondary particles (positive ions, neutrals, and electrons are accelerated and deflected by the electric and magnetic fields inside the accelerator and may induce more secondaries after a likely impact with the accelerator grids. This chain of reactions is responsible for a non-negligible heat load on the grids and must be understood in detail. In this paper, we will provide a comprehensive summary of the physics involved in the process of secondary emission in a typical ITER-like negative ion electrostatic accelerator together with a precise description of the numerical method and approximations involved. As an example, the multiaperture-multigrid accelerator concept will be discussed.

Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Ewinger, H.P.

1993-05-01

This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C 2 , CH 2 , C 2 H, and C 3 , as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with suitable signal patterns. (orig./BBR) [de

Real-Time Online Monitoring of the Ion Range by Means of Prompt Secondary Radiations

International Nuclear Information System (INIS)

Krimmer, J.; Balleyguier, L.; Caponetto, L.; Chen, X.; Dahoumane, M.; Dauvergne, D.; De Rydt, M.; Dedes, G.; Della Negra, R.; Deng, S.M.; Ley, J.L.; Mathez, H.; Pinto, M.; Ray, C.; Richard, M.H.; Reithinger, V.; Roellinghoff, F.; Testa, E.; Zoccarato, Y.; Baudot, J.; Winter, M.; Brons, S.; Chabot, M.; Force, P.; Joly, B.; Insa, C.; Lambert, D.; Lestand, L.; Magne, M.; Montarou, G.; Freud, N.; Letang, J.M.; Lojacono, X.; Maxim, V.; Prostk, R.; Herault, J.; La Tessa, C.; Pleskac, R.; Vanstalle, M.; Parodi, K.; Prieels, D.; Smeets, J.; Rinaldi, I.

2013-06-01

Prompt secondary radiations such as gamma rays and protons can be used for ion-range monitoring during ion therapy either on an energy-slice basis or on a pencil-beam basis. We present a review of the ongoing activities in terms of detector developments, imaging, experimental and theoretical physics issues concerning the correlation between the physical dose and hadronic processes. (authors)

DNA damage on nano- and micrometer scales impacts dicentric induction: computer modelling of ion microbeam experiments

Science.gov (United States)

Friedland, Werner; Kundrat, Pavel; Schmitt, Elke

2016-07-01

Detailed understanding of the enhanced relative biological effectiveness (RBE) of ions, in particular at high linear energy transfer (LET) values, is needed to fully explore the radiation risk of manned space missions. It is generally accepted that the enhanced RBE of high-LET particles results from the DNA lesion patterns, in particular DNA double-strand breaks (DSB), due to the spatial clustering of energy deposits around their trajectories. In conventional experiments on biological effects of radiation types of diverse quality, however, clustering of energy deposition events on nanometer scale that is relevant for the induction and local complexity of DSB is inherently interlinked with regional (sub-)micrometer-scale DSB clustering along the particle tracks. Due to this limitation, the role of both (nano- and micrometer) scales on the induction of diverse biological endpoints cannot be frankly separated. To address this issue in a unique way, experiments at the ion microbeam SNAKE [1] and corresponding track-structure based model calculations of DSB induction and subsequent repair with the biophysical code PARTRAC [2] have been performed. In the experiments, hybrid human-hamster A_{L} cells were irradiated with 20 MeV (2.6 keV/μm) protons, 45 MeV (60 keV/μm) lithium ions or 55 MeV (310 keV/μm) carbon ions. The ions were either quasi-homogeneously distributed or focused to 0.5 x 1 μm^{2} spots on regular matrix patterns of 5.4 μm, 7.6 μm and 10.6 μm grid size, with pre-defined particle numbers per spot so as to deposit a mean dose of 1.7 Gy for all irradiation patterns. As expected, the induction of dicentrics by homogeneous irradiation increased with LET: lithium and carbon ions induced about two- and four-fold higher yields of dicentrics than protons. The induction of dicentrics is, however, affected by µm-scale, too: focusing 20 lithium ions or 451 protons per spot on a 10.6 μm grid induced two or three times more dicentrics, respectively, than a

Scanning ion microscopy with low energy lithium ions

International Nuclear Information System (INIS)

Twedt, Kevin A.; Chen, Lei; McClelland, Jabez J.

2014-01-01

Using an ion source based on photoionization of laser-cooled lithium atoms, we have developed a scanning ion microscope with probe sizes of a few tens of nanometers and beam energies from 500 eV to 5 keV. These beam energies are much lower than the typical operating energies of the helium ion microscope or gallium focused ion beam systems. We demonstrate how low energy can be advantageous in ion microscopy when detecting backscattered ions, due to a decreased interaction volume and the potential for surface sensitive composition analysis. As an example application that demonstrates these advantages, we non-destructively image the removal of a thin residual resist layer during plasma etching in a nano-imprint lithography process. - Highlights: • We use an ion source based on photoionization of laser-cooled lithium atoms. • The ion source makes possible a low energy (500 eV to 5 keV) scanning ion microscope. • Low energy is preferred for ion microscopy with backscattered ions. • We use the microscope to image a thin resist used in nano-imprint lithography

Comparison of secondary ion emission induced in silicon oxide by MeV and KeV ion bombardment

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.; Szymczak, W.; Wittmaack, K.

1993-09-01

The surface and near-surface composition of SiO 2 layers, has been investigated by negative secondary ion emission mass spectrometry (SIMS) using MeV and KeV ion bombardment in combination with time-of-flight (TOF) mass analysis. The spectra recorded in the mass range 0-100 u are dominated by surface impurities, notably hydrocarbons and silicon polyanions incorporating H and OH entities. The characteristic (fragmentation) patterns are quite different for light and high-velocity ion impact. In high-velocity TOF-SIMS analysis of P-doped layers, prepared by chemical vapour deposition (CVD), the mass lines at 63 and 79 u are very prominent and appear to correlate with the phosphorus concentration (PO 2 and PO 3 , respectively). It is shown, however, that for unambiguous P analysis one has to use dynamic SIMS or high mass resolution. (author) 11 refs., 5 figs

Scaling of Sweet-Parker reconnection with secondary islands

International Nuclear Information System (INIS)

Cassak, P. A.; Shay, M. A.; Drake, J. F.

2009-01-01

Sweet-Parker (collisional) magnetic reconnection at high Lundquist number is modified by secondary islands. Daughton et al. [Phys. Rev. Lett. 103, 065004 (2009)] suggested the Sweet-Parker model governs the fragmented current sheet segments. If true, the reconnection rate would increase by the square root of the number of secondary islands. High Lundquist number resistive magnetohydrodynamic simulations are presented which agree, in a time-averaged sense, with the predicted scaling. This result may have important implications for energy storage before a solar eruption and its subsequent release.

Observation of reduction of secondary electron emission from helium ion impact due to plasma-generated nanostructured tungsten fuzz

International Nuclear Information System (INIS)

Hollmann, E M; Doerner, R P; Nishijima, D; Pigarov, A Yu

2017-01-01

Growth of nanostructured fuzz on a tungsten target in a helium plasma is found to cause a significant (∼3×) reduction in ion impact secondary electron emission in a linear plasma device. The ion impact secondary electron emission is separated from the electron impact secondary electron emission by varying the target bias voltage and fitting to expected contributions from electron impact, both thermal and non-thermal; with the non-thermal electron contribution being modeled using Monte-Carlo simulations. The observed (∼3×) reduction is similar in magnitude to the (∼2×) reduction observed in previous work for the effect of tungsten fuzz formation on secondary electron emission due to electron impact. It is hypothesized that the observed reduction results from re-absorption of secondary electrons in the tungsten fuzz. (paper)

Characteristics of a wire ion plasma source and a secondary emission electron gun

International Nuclear Information System (INIS)

Hotta, Eiki; Osawa, Teruya; Urai, Hajime; Suzuki, Mitsuaki; Yasui, Hiroyuki; Tamagawa, Tohru

1993-01-01

Electrical characteristics of a wire ion plasma source (WIPS) and a secondary emission electron gun, for which the WIPS is used as an ion source, will be reported. The WIPS is a cold-cathode gaseous discharge device, in which a radial electron trapping permits an extremely low pressure gaseous discharge with very low applied voltages. The time evolutions of temperature and density of afterglow plasma were measured with a double probe. In the case of P 0 = 25 mTorr He and the maximum discharge current of 200 A, the temperature and density of electron were about 20 eV and of the order of 10 18 m -3 , respectively, just after the distinction of discharge. The ion current density measured by a biased ion collector (BIC) on the discharge tube wall was found to reach up to 300 mA/cm 2 . A secondary emission electron gun was set on the discharge tube wall opposite to the BIC. An earthed mesh net is installed at a height of 8 mm just in front of the cathode. The maximum negative bias voltage applied to the cathode is limited to -50 kV by the local breakdown in the gun, which occurred synchronously with the WIPS discharge. The electron beam current was measured by the BIC, in which an aluminum foil with a width of 2 μm was placed on instead of the earthed mesh net. At the cathode voltage of -30 kV, the measured beam current density was 220 mA/cm 2 . The extraporation of the resulted curve indicates that if the cathode voltage is -100 kV, the current density will reach to 1 A/cm 2 . The energy spectrum of the electron beam was measured with a magnetic energy analyzer, which was set in place of the BIC. The energy spread is about 300 eV at the central energy of 40 keV. Thus, they demonstrated the possibility of a high current density secondary emission electron gun, for which a WIPS is used as an ion source

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

Directory of Open Access Journals (Sweden)

Yutaka Moritomo

2015-09-01

Full Text Available Manganese hexacyanoferrate (Mn-PBA is a promising cathode material forsodium-ion secondary battery (SIB with high average voltage (=3.4 V against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grownto 15 C (glucose-treated. Our observation suggests that thermal treatment is quite effectivefor insulating coordination polymers.

Modeling secondary electron emission from nanostructured materials in helium ion microscope

International Nuclear Information System (INIS)

Ohya, K.; Yamanaka, T.

2013-01-01

Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale.

Science.gov (United States)

Colliex, Christian; Kociak, Mathieu; Stéphan, Odile

2016-03-01

Since their first realization, electron microscopes have demonstrated their unique ability to map with highest spatial resolution (sub-atomic in most recent instruments) the position of atoms as a consequence of the strong scattering of the incident high energy electrons by the nuclei of the material under investigation. When interacting with the electron clouds either on atomic orbitals or delocalized over the specimen, the associated energy transfer, measured and analyzed as an energy loss (Electron Energy Loss Spectroscopy) gives access to analytical properties (atom identification, electron states symmetry and localization). In the moderate energy-loss domain (corresponding to an optical spectral domain from the infrared (IR) to the rather far ultra violet (UV), EELS spectra exhibit characteristic collective excitations of the rather-free electron gas, known as plasmons. Boundary conditions, such as surfaces and/or interfaces between metallic and dielectric media, generate localized surface charge oscillations, surface plasmons (SP), which are associated with confined electric fields. This domain of research has been extraordinarily revived over the past few years as a consequence of the burst of interest for structures and devices guiding, enhancing and controlling light at the sub-wavelength scale. The present review focuses on the study of these surface plasmons with an electron microscopy-based approach which associates spectroscopy and mapping at the level of a single and well-defined nano-object, typically at the nanometer scale i.e. much improved with respect to standard, and even near-field, optical techniques. After calling to mind some early studies, we will briefly mention a few basic aspects of the required instrumentation and associated theoretical tools to interpret the very rich data sets recorded with the latest generation of (Scanning)TEM microscopes. The following paragraphs will review in more detail the results obtained on simple planar and

Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Colliex, Christian, E-mail: christian.colliex@u-psud.fr; Kociak, Mathieu; Stéphan, Odile

2016-03-15

Since their first realization, electron microscopes have demonstrated their unique ability to map with highest spatial resolution (sub-atomic in most recent instruments) the position of atoms as a consequence of the strong scattering of the incident high energy electrons by the nuclei of the material under investigation. When interacting with the electron clouds either on atomic orbitals or delocalized over the specimen, the associated energy transfer, measured and analyzed as an energy loss (Electron Energy Loss Spectroscopy) gives access to analytical properties (atom identification, electron states symmetry and localization). In the moderate energy-loss domain (corresponding to an optical spectral domain from the infrared (IR) to the rather far ultra violet (UV), EELS spectra exhibit characteristic collective excitations of the rather-free electron gas, known as plasmons. Boundary conditions, such as surfaces and/or interfaces between metallic and dielectric media, generate localized surface charge oscillations, surface plasmons (SP), which are associated with confined electric fields. This domain of research has been extraordinarily revived over the past few years as a consequence of the burst of interest for structures and devices guiding, enhancing and controlling light at the sub-wavelength scale. The present review focuses on the study of these surface plasmons with an electron microscopy-based approach which associates spectroscopy and mapping at the level of a single and well-defined nano-object, typically at the nanometer scale i.e. much improved with respect to standard, and even near-field, optical techniques. After calling to mind some early studies, we will briefly mention a few basic aspects of the required instrumentation and associated theoretical tools to interpret the very rich data sets recorded with the latest generation of (Scanning)TEM microscopes. The following paragraphs will review in more detail the results obtained on simple planar and

Electron Energy Loss Spectroscopy imaging of surface plasmons at the nanometer scale

International Nuclear Information System (INIS)

Colliex, Christian; Kociak, Mathieu; Stéphan, Odile

2016-01-01

Since their first realization, electron microscopes have demonstrated their unique ability to map with highest spatial resolution (sub-atomic in most recent instruments) the position of atoms as a consequence of the strong scattering of the incident high energy electrons by the nuclei of the material under investigation. When interacting with the electron clouds either on atomic orbitals or delocalized over the specimen, the associated energy transfer, measured and analyzed as an energy loss (Electron Energy Loss Spectroscopy) gives access to analytical properties (atom identification, electron states symmetry and localization). In the moderate energy-loss domain (corresponding to an optical spectral domain from the infrared (IR) to the rather far ultra violet (UV), EELS spectra exhibit characteristic collective excitations of the rather-free electron gas, known as plasmons. Boundary conditions, such as surfaces and/or interfaces between metallic and dielectric media, generate localized surface charge oscillations, surface plasmons (SP), which are associated with confined electric fields. This domain of research has been extraordinarily revived over the past few years as a consequence of the burst of interest for structures and devices guiding, enhancing and controlling light at the sub-wavelength scale. The present review focuses on the study of these surface plasmons with an electron microscopy-based approach which associates spectroscopy and mapping at the level of a single and well-defined nano-object, typically at the nanometer scale i.e. much improved with respect to standard, and even near-field, optical techniques. After calling to mind some early studies, we will briefly mention a few basic aspects of the required instrumentation and associated theoretical tools to interpret the very rich data sets recorded with the latest generation of (Scanning)TEM microscopes. The following paragraphs will review in more detail the results obtained on simple planar and

An algorithm to calculate secondary sputtering by the reflection of ions in two dimensions

International Nuclear Information System (INIS)

Smith, R.; Tagg, M.A.

1986-01-01

A method for computing the secondary sputtering of ions reflected from two-dimensional surfaces is described. The surface contour is first approximated by a set of line segments and the displacement of these line segments under ion erosion is determined computationally, by summing the contributions of the primary and reflected fluxes. This method can be used as an alternative to the method of characteristics which is normally used to determine primary ion beam effects. Some simple examples are evaluated. These examples illustrate that primary surface erosion theory is not in itself sufficient to explain the topography which can exist on an ion-eroded surface, particularly close to steep-sided structures. (author)

Contributions of secondary fragmentation by carbon ion beams in water phantom: Monte Carlo simulation

International Nuclear Information System (INIS)

Ying, C K; Bolst, David; Tran, Linh T.; Guatelli, Susanna; Rosenfeld, A. B.; Kamil, W A

2017-01-01

Heavy-particle therapy such as carbon ion therapy is currently very popular because of its superior conformality in terms of dose distribution and higher Relative Biological Effectiveness (RBE). However, carbon ion beams produce a complex mixed radiation field, which needs to be fully characterised. In this study, the fragmentation of a 290 MeV/u primary carbon ion beam was studied using the Geant4 Monte Carlo Toolkit. When the primary carbon ion beam interacts with water, secondary light charged particles (H, He, Li, Be, B) and fast neutrons are produced, contributing to the dose, especially after the distal edge of the Bragg peak. (paper)

Gyrokinetic Simulations of Solar Wind Turbulence from Ion to Electron Scales

International Nuclear Information System (INIS)

Howes, G. G.; TenBarge, J. M.; Dorland, W.; Numata, R.; Quataert, E.; Schekochihin, A. A.; Tatsuno, T.

2011-01-01

A three-dimensional, nonlinear gyrokinetic simulation of plasma turbulence resolving scales from the ion to electron gyroradius with a realistic mass ratio is presented, where all damping is provided by resolved physical mechanisms. The resulting energy spectra are quantitatively consistent with a magnetic power spectrum scaling of k -2.8 as observed in in situ spacecraft measurements of the 'dissipation range' of solar wind turbulence. Despite the strongly nonlinear nature of the turbulence, the linear kinetic Alfven wave mode quantitatively describes the polarization of the turbulent fluctuations. The collisional ion heating is measured at subion-Larmor radius scales, which provides evidence of the ion entropy cascade in an electromagnetic turbulence simulation.

Secondary particle tracks generated by ion beam irradiation

Science.gov (United States)

García, Gustavo

2015-05-01

The Low Energy Particle Track Simulation (LEPTS) procedure is a powerful complementary tool to include the effect of low energy electrons and positrons in medical applications of radiation. In particular, for ion-beam cancer treatments provides a detailed description of the role of the secondary electrons abundantly generated around the Bragg peak as well as the possibility of using transmuted positron emitters (C11, O15) as a complement for ion-beam dosimetry. In this study we present interaction probability data derived from IAM-SCAR corrective factors for liquid environments. Using these data, single electron and positron tracks in liquid water and pyrimidine have been simulated providing information about energy deposition as well as the number and type of interactions taking place in any selected ``nanovolume'' of the irradiated area. In collaboration with Francisco Blanco, Universidad Complutense de Madrid; Antonio Mu noz, Centro de Investigaciones Energéticas Medioambientales y Tecnológicas and Diogo Almeida, Filipe Ferreira da Silva, Paulo Lim ao-Vieira, Universidade Nova de Lisboa. Supported by the Spanish and Portuguese governments.

Swift heavy ion irradiation induced electrical degradation in deca-nanometer MOSFETs

Energy Technology Data Exchange (ETDEWEB)

Ma, Yao; Yang, Zhimei; Gong, Min [Key Laboratory for Microelectronics, College of Physical Science and Technology, Sichuan University, Chengdu 610064 (China); Key Laboratory of High Energy Density Physics and Technology of Ministry of Education, Sichuan University, Chengdu 610064 (China); Gao, Bo; Li, Yun; Lin, Wei; Li, Jinbo; Xia, Zhuohui [Key Laboratory for Microelectronics, College of Physical Science and Technology, Sichuan University, Chengdu 610064 (China)

2016-09-15

In this work, degradation of the electrical characteristics of 65 nm nMOSFETs under swift heavy ion irradiation is investigated. It was found that a heavy ion can generate a localized region of physical damage (ion latent track) in the gate oxide. This is the likely cause for the increased gate leakage current and soft breakdown (SBD) then hard breakdown (HBD) of the gate oxide. Except in the case of HBD, the devices retain their functionality but with degraded transconductance. The degraded gate oxide exhibits early breakdown behavior compatible with the model of defect generation and percolation path formation in the percolation model.

Microstructure evolution in carbon-ion implanted sapphire

International Nuclear Information System (INIS)

Orwa, J. O.; McCallum, J. C.; Jamieson, D. N.; Prawer, S.; Peng, J. L.; Rubanov, S.

2010-01-01

Carbon ions of MeV energy were implanted into sapphire to fluences of 1x10 17 or 2x10 17 cm -2 and thermally annealed in forming gas (4% H in Ar) for 1 h. Secondary ion mass spectroscopy results obtained from the lower dose implant showed retention of implanted carbon and accumulation of H near the end of range in the C implanted and annealed sample. Three distinct regions were identified by transmission electron microscopy of the implanted region in the higher dose implant. First, in the near surface region, was a low damage region (L 1 ) composed of crystalline sapphire and a high density of plateletlike defects. Underneath this was a thin, highly damaged and amorphized region (L 2 ) near the end of range in which a mixture of i-carbon and nanodiamond phases are present. Finally, there was a pristine, undamaged sapphire region (L 3 ) beyond the end of range. In the annealed sample some evidence of the presence of diamond nanoclusters was found deep within the implanted layer near the projected range of the C ions. These results are compared with our previous work on carbon implanted quartz in which nanodiamond phases were formed only a few tens of nanometers from the surface, a considerable distance from the projected range of the ions, suggesting that significant out diffusion of the implanted carbon had occurred.

Time-of-flight secondary-ion mass spectrometry on thiole self-assembly monolayers on gold; Flugzeit-Sekundaerionenmassenspektrometrie an Thiol self assembly Monolagen auf Gold

Energy Technology Data Exchange (ETDEWEB)

Schroeder, M.

2006-07-01

Aim of this thesis was to get a deeper understanding for the influence of different matrix effects on the emission of molecular secondary ions. For the estimation of the influence of the primary-ion surface interaction a series of different primary-ion species was applied, which differ by mass, kinetic energy, and composition (monoatomic or polyatomic). In the framework of the presented results different matrix effects were studied. For this systematically the influence of the substrate-thiolate, the thiolate-thiolate, and the primary-ion substrate interaction on the formation of characteristic secondary ions was quantified. For the corresponding considerations beside the thiolate secondary ions M{sup -} the gold-thiolate clusters of the type Au{sub x+1}M{sub x}{sup -} were referred to.

Nanocavity formation processes in MgO(100) by light ion (D, He, Li) and heavy ion (Kr, Cu, Au) implantation

NARCIS (Netherlands)

Veen, A. van; Fedorov, A.V.; Schut, H.; Labohm, F.; Kooi, B.J.; Hosson, J.Th.M. De

2002-01-01

In studies on the controlled growth of metallic precipitates in MgO it is attempted to use nanometer size cavities as precursors for formation of metallic precipitates. In MgO nanocavities can easily be generated by light gas ion bombardment at room temperature with typically 30 keV ion energy to a

Validation Evidence of the Motivation for Teaching Scale in Secondary Education.

Science.gov (United States)

Abós, Ángel; Sevil, Javier; Martín-Albo, José; Aibar, Alberto; García-González, Luis

2018-04-10

Grounded in self-determination theory, the aim of this study was to develop a scale with adequate psychometric properties to assess motivation for teaching and to explain some outcomes of secondary education teachers at work. The sample comprised 584 secondary education teachers. Analyses supported the five-factor model (intrinsic motivation, identified regulation, introjected regulation, external regulation and amotivation) and indicated the presence of a continuum of self-determination. Evidence of reliability was provided by Cronbach's alpha, composite reliability and average variance extracted. Multigroup confirmatory factor analyses supported the partial invariance (configural and metric) of the scale in different sub-samples, in terms of gender and type of school. Concurrent validity was analyzed by a structural equation modeling that explained 71% of the work dedication variance and 69% of the boredom at work variance. Work dedication was positively predicted by intrinsic motivation (ß = .56, p amotivation (ß = -.49, p amotivation (ß = .68, p < .001). The Motivation for Teaching Scale in Secondary Education (Spanish acronym EME-ES, Escala de Motivación por la Enseñanza en Educación Secundaria) is discussed as a valid and reliable instrument. This is the first specific scale in the work context of secondary teachers that has integrated the five-factor structure together with their dedication and boredom at work.

Mid-Award Progress Report for Department of Energy Office of Science Graduate Student Research Program

Energy Technology Data Exchange (ETDEWEB)

Hoffman, M. K. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2017-09-14

The purpose of the work proposed for this study is to investigate the behavior and transport mechanisms for cesium-137 in soils collected from contaminated sites with distinct source release scenarios. More specifically, this study aims to determine with which elements and minerals cesium-137 associates in these various environments to more reliably predict its migration in the subsurface. This will be achieved using a state-of-the-art analysis technique available at Lawrence Livermore National Laboratory (LLNL) known as NanoSIMS. Nano-scale secondary ion mass spectrometry, or NanoSIMS, is a destructive surface analysis technique in which positive secondary ions are generated from the surface of a sample and then quantified based on their mass-to-charge ratio (m/z) using mass spectrometry. The data collected about the secondary ions can then be used to create isotope-specific spatial maps with a resolution of a few hundred nanometers and depth profiles that show the variation of the secondary ion intensity with sputtering time. This should be an ideal technique for locating cesium-137 in a sample, as cesium is an easily ionized element, meaning the yield of secondary cesium (Cs) ions produced should be high and making the identification of cesium-137 straight forward.

Direct observation and analysis of yolk-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer

Energy Technology Data Exchange (ETDEWEB)

Asahina, Shunsuke; Suga, Mitsuo; Takahashi, Hideyuki [JEOL Ltd., SM Business Unit, Tokyo (Japan); Young Jeong, Hu [Graduate School of EEWS, WCU/BK21+, KAIST, Daejeon 305-701 (Korea, Republic of); Galeano, Carolina; Schüth, Ferdi [Department of Heterogeneous Catalysis, Max-Planck-Institut für Kohlenforschung, Mülheim (Germany); Terasaki, Osamu, E-mail: terasaki@mmk.su.se, E-mail: terasaki@kaist.ac.kr [Graduate School of EEWS, WCU/BK21+, KAIST, Daejeon 305-701 (Korea, Republic of); Department of Materials and Environmental Chemistry, Berzelii Centre EXSELENT on Porous Materials, Stockholm University, SE-10691 Stockholm (Sweden)

2014-11-01

Nanometal particles show characteristic features in chemical and physical properties depending on their sizes and shapes. For keeping and further enhancing their features, the particles should be protected from coalescence or degradation. One approach is to encapsulate the nanometal particles inside pores with chemically inert or functional materials, such as carbon, polymer, and metal oxides, which contain mesopores to allow permeation of only chemicals not the nanometal particles. Recently developed low-voltage high-resolution scanning electron microscopy was applied to the study of structural, chemical, and electron state of both nanometal particles and encapsulating materials in yolk-shell materials of Au@C, Ru/Pt@C, Au@TiO{sub 2}, and Pt@Polymer. Progresses in the following categories were shown for the yolk-shell materials: (i) resolution of topographic image contrast by secondary electrons, of atomic-number contrast by back-scattered electrons, and of elemental mapping by X-ray energy dispersive spectroscopy; (ii) sample preparation for observing internal structures; and (iii) X-ray spectroscopy such as soft X-ray emission spectroscopy. Transmission electron microscopy was also used for characterization of Au@C.

Quantization of secondary ion mass spectrometry (SIMS) data using external and internal standards

International Nuclear Information System (INIS)

Gnaser, H.

1983-01-01

Some aspects of multi-dimensional characterization of solids by secondary ion mass spectrometry (SIMS) are given. A theoretical part discusses methods for the quantization of SIMS data and the most prominent effects of ion-solid interactions as related to SIMS. After a description of the instrument used for experiments (a quadrupole-equipped ion microprobe featuring a liquid metal ion source in addition to the standard duoplasmatron gas ion source) the first experimental section is devoted to the determination of practical sensitivities and relative sensitivity factors for selected pure elements, binary and treary alloys and multicomponent systems. For 23 pure elements practical sensitivities under O + 2 bombardment also have been compared to those under In + -bombardment; it was shown that on oxygen saturated surfaces yields under In + -bombardment are higher, this making feasible use of submicron In-beams for surface analysis. In the second experimental section boron implants in silicon have been used for studying depth profiling capabilities of the instrument. Sputtering yields of Si and degrees of ionization of both B and Si have been measured. It has been shown that implantation profiles may deviate considerably from Gaussian but can be described by means of mathematical distribution functions. In the third experimental section depth resolution of the erosion process has been studied by profiling a Ni/Cr multilayer sample (100 A single layer) and been found to be approximately constant over the depth range investigated. Quantization of depth profiles, usually distorted by matrix effects, has been attempted using the primary beam species (In) as internal implantation standard. Some problems in connection with the conversion of secondary ion micrographs to concentration maps are discussed. Elemental detection limits in multidimensional SIMS analysis are given in dependence of primary beam size and total eroded depth. (Author)

Combining combing and secondary ion mass spectrometry to study DNA on chips using 13C and 15N labeling [version 1; referees: 2 approved

Directory of Open Access Journals (Sweden)

Armelle Cabin-Flaman

2016-06-01

Full Text Available Dynamic secondary ion mass spectrometry (D-SIMS imaging of combed DNA – the combing, imaging by SIMS or CIS method – has been developed previously using a standard NanoSIMS 50 to reveal, on the 50 nm scale, individual DNA fibers labeled with different, non-radioactive isotopes in vivo and to quantify these isotopes. This makes CIS especially suitable for determining the times, places and rates of DNA synthesis as well as the detection of the fine-scale re-arrangements of DNA and of molecules associated with combed DNA fibers. Here, we show how CIS may be extended to 13C-labeling via the detection and quantification of the 13C14N- recombinant ion and the use of the 13C:12C ratio, we discuss how CIS might permit three successive labels, and we suggest ideas that might be explored using CIS.

Fabrication and characterization of a nanometer-sized optical fiber electrode based on selective chemical etching for scanning electrochemical/optical microscopy.

Science.gov (United States)

Maruyama, Kenichi; Ohkawa, Hiroyuki; Ogawa, Sho; Ueda, Akio; Niwa, Osamu; Suzuki, Koji

2006-03-15

We have already reported a method for fabricating ultramicroelectrodes (Suzuki, K. JP Patent, 2004-45394, 2004). This method is based on the selective chemical etching of optical fibers. In this work, we undertake a detailed investigation involving a combination of etched optical fibers with various types of tapered tip (protruding-shape, double- (or pencil-) shape and triple-tapered electrode) and insulation with electrophoretic paint. Our goal is to establish a method for fabricating nanometer-sized optical fiber electrodes with high reproducibility. As a result, we realized pencil-shaped and triple-tapered electrodes that had radii in the nanometer range with high reproducibility. These nanometer-sized electrodes showed well-defined sigmoidal curves and stable diffusion-limited responses with cyclic voltammetry. The pencil-shaped optical fiber, which has a conical tip with a cone angle of 20 degrees , was effective for controlling the electrode radius. The pencil-shaped electrodes had higher reproducibility and smaller electrode radii (r(app) etched optical fiber electrodes. By using a pencil-shaped electrode with a 105-nm radius as a probe, we obtained simultaneous electrochemical and optical images of an implantable interdigitated array electrode. We achieved nanometer-scale resolution with a combination of scanning electrochemical microscopy SECM and optical microscopy. The resolution of the electrochemical and optical images indicated sizes of 300 and 930 nm, respectively. The neurites of living PC12 cells were also successfully imaged on a 1.6-microm scale by using the negative feedback mode of an SECM.

Microdosimetry of proton and carbon ions

Energy Technology Data Exchange (ETDEWEB)

Liamsuwan, Thiansin [Thailand Institute of Nuclear Technology, Ongkharak, Nakhon Nayok 26120 (Thailand); Hultqvist, Martha [Medical Radiation Physics, Department of Physics, Stockholm University, SE-10691 (Sweden); Lindborg, Lennart; Nikjoo, Hooshang, E-mail: hooshang.nikjoo@ki.se [Radiation Biophysics Group, Department of Oncology-Pathology, Karolinska Institutet, Box 260 SE-17176, Stockholm (Sweden); Uehara, Shuzo [School of Health Sciences, Kyushu University, Fukuoka 812-8581 (Japan)

2014-08-15

Purpose: To investigate microdosimetry properties of 160 MeV/u protons and 290 MeV/u{sup 12}C ion beams in small volumes of diameters 10–100 nm. Methods: Energy distributions of primary particles and nuclear fragments in the beams were calculated from simulations with the general purpose code SHIELD-HIT, while energy depositions by monoenergetic ions in nanometer volumes were obtained from the event-by-event Monte Carlo track structure ion code PITS99 coupled with the electron track structure code KURBUC. Results: The results are presented for frequencies of energy depositions in cylindrical targets of diameters 10–100 nm, dose distributionsyd(y) in lineal energy y, and dose-mean lineal energies y{sup ¯}{sub D}. For monoenergetic ions, the y{sup ¯}{sub D} was found to increase with an increasing target size for high-linear energy transfer (LET) ions, but decrease with an increasing target size for low-LET ions. Compared to the depth dose profile of the ion beams, the maximum of the y{sup ¯}{sub D} depth profile for the 160 MeV proton beam was located at ∼0.5 cm behind the Bragg peak maximum, while the y{sup ¯}{sub D} peak of the 290 MeV/u {sup 12}C beam coincided well with the peak of the absorbed dose profile. Differences between the y{sup ¯}{sub D} and dose-averaged linear energy transfer (LET{sub D}) were large in the proton beam for both target volumes studied, and in the {sup 12}C beam for the 10 nm diameter cylindrical volumes. The y{sup ¯}{sub D} determined for 100 nm diameter cylindrical volumes in the {sup 12}C beam was approximately equal to the LET{sub D}. The contributions from secondary particles to the y{sup ¯}{sub D} of the beams are presented, including the contributions from secondary protons in the proton beam and from fragments with atomic number Z = 1–6 in the {sup 12}C beam. Conclusions: The present investigation provides an insight into differences in energy depositions in subcellular-size volumes when irradiated by proton and

The molecular mechanism of ion-dependent gating in secondary transporters.

Directory of Open Access Journals (Sweden)

Chunfeng Zhao

2013-10-01

Full Text Available LeuT-like fold Na-dependent secondary active transporters form a large family of integral membrane proteins that transport various substrates against their concentration gradient across lipid membranes, using the free energy stored in the downhill concentration gradient of sodium ions. These transporters play an active role in synaptic transmission, the delivery of key nutrients, and the maintenance of osmotic pressure inside the cell. It is generally believed that binding of an ion and/or a substrate drives the conformational dynamics of the transporter. However, the exact mechanism for converting ion binding into useful work has yet to be established. Using a multi-dimensional path sampling (string-method followed by all-atom free energy simulations, we established the principal thermodynamic and kinetic components governing the ion-dependent conformational dynamics of a LeuT-like fold transporter, the sodium/benzyl-hydantoin symporter Mhp1, for an entire conformational cycle. We found that inward-facing and outward-facing states of Mhp1 display nearly the same free energies with an ion absent from the Na2 site conserved across the LeuT-like fold transporters. The barrier separating an apo-state from inward-facing or outward-facing states of the transporter is very low, suggesting stochastic gating in the absence of ion/substrate bound. In contrast, the binding of a Na2 ion shifts the free energy stabilizing the outward-facing state and promoting substrate binding. Our results indicate that ion binding to the Na2 site may also play a key role in the intracellular thin gate dynamics modulation by altering its interactions with the transmembrane helix 5 (TM5. The Potential of Mean Force (PMF computations for a substrate entrance displays two energy minima that correspond to the locations of the main binding site S1 and proposed allosteric S2 binding site. However, it was found that substrate's binds to the site S1 ∼5 kcal/mol more favorable

Secondary ion emission

International Nuclear Information System (INIS)

Krohn, V.E.

1976-01-01

The Saha-Langmuir equation that describes the equilibrium emission process, surface ionization, has also been used to describe ion yields observed in the non-equilibrium emission process, sputtering. In describing sputtering, it is probably best to include the potential due to an image charge in the expression for negative as well as positive ion yield and to treat the work function and the temperature as parameters having limited physical significance. Arguments are presented to suggest that sputtered material is not emitted from a plasma. (Auth.)

Mechanical design of ultraprecision weak-link stages for nanometer-scale x-ray imaging

Energy Technology Data Exchange (ETDEWEB)

Shu, D [APS Engineering Support Division, Argonne National Laboratory, Argonne, IL 60439 (United States); Maser, J, E-mail: shu@aps.anl.go [Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 (United States)

2009-09-01

A nanopositioning diagnostic setup has been built to support the Argonne Center for Nanoscale Materials (CNM) nanoprobe instrument commissioning process at the APS. Its laser Doppler interferometer system provides subnanometer positioning diagnostic resolution with large dynamic range. A set of original APS designed ultraprecision PZT-driven weak-link stages with high-stiffness motor-driven stages has been tested with this diagnostic setup. In this paper we present a preliminary test result of the ultraprecision weak-link stage system developed for the CNM hard x-ray nanoprobe instrument at APS sector 26. A test result for a novel laminar weak-link mechanism with sub-centimeter travel range and sub-nanometer positioning resolution is also introduced in this paper as a future work.

Ichthyosiform scaling secondary to megavoltage radiotherapy

International Nuclear Information System (INIS)

Ross, E.V.

1991-01-01

Acquired ichthyosis is a rare dermatosis associated with a number of malignancies. Side effects seen on the skin secondary to megavoltage radiotherapy are uncommon but may include fine dry desquamation and tanning. The authors present a case of ichthyosiform scaling limited to the radiation fields in a patient treated for brain metastases of a primary small cell lung carcinoma. The reader is reminded that side effects of megavoltage treatment do occur on the skin. A brief review of these effects is included. 5 references

Distance scaling of electric-field noise in a surface-electrode ion trap

Science.gov (United States)

Sedlacek, J. A.; Greene, A.; Stuart, J.; McConnell, R.; Bruzewicz, C. D.; Sage, J. M.; Chiaverini, J.

2018-02-01

We investigate anomalous ion-motional heating, a limitation to multiqubit quantum-logic gate fidelity in trapped-ion systems, as a function of ion-electrode separation. Using a multizone surface-electrode trap in which ions can be held at five discrete distances from the metal electrodes, we measure power-law dependencies of the electric-field noise experienced by the ion on the ion-electrode distance d . We find a scaling of approximately d-4 regardless of whether the electrodes are at room temperature or cryogenic temperature, despite the fact that the heating rates are approximately two orders of magnitude smaller in the latter case. Through auxiliary measurements using the application of noise to the electrodes, we rule out technical limitations to the measured heating rates and scalings. We also measure the frequency scaling of the inherent electric-field noise close to 1 /f at both temperatures. These measurements eliminate from consideration anomalous-heating models which do not have a d-4 distance dependence, including several microscopic models of current interest.

Helium ion lithography principles and performance

NARCIS (Netherlands)

Drift, E. van der; Maas, D.J.

2012-01-01

Recent developments show that Scanning Helium Ion Beam Lithography (SHIBL) with a sub-nanometer beam diameter is a promising alternative fabrication technique for high-resolution nanostructures at high pattern densities. Key principles and critical conditions of the technique are explained. From

Nanometer-Scale Dissection of Chromosomes by Atomic Force Microscopy Combined with Heat-Denaturing Treatment

Science.gov (United States)

Tsukamoto, Kazumi; Kuwazaki, Seigo; Yamamoto, Kimiko; Shichiri, Motoharu; Yoshino, Tomoyuki; Ohtani, Toshio; Sugiyama, Shigeru

2006-03-01

We have developed a method for dissecting chromosome fragments with a size of a few hundred nanometers by atomic force microscopy (AFM). By using this method, we demonstrated reproducible dissections of silkworm chromosomes in the pachytene phase. The dissected fragments were successfully recovered on the cantilever tips, as confirmed by fluorescent microscopy using fluorescent stained chromosomes. To recover dissected chromosome fragments from a larger chromosome, such as the human metaphase chromosome of a somatic cell, heat denaturation was found to be effective. Further improvements in this method may lead to a novel tool for isolating valuable genes and/or investigating local genome structures in the near future.

Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy

International Nuclear Information System (INIS)

Pantzas, K; Voss, P L; Ougazzaden, A; Patriarche, G; Largeau, L; Mauguin, O; Troadec, D; Gautier, S; Moudakir, T; Suresh, S

2012-01-01

Using elastic scattering theory we show that a small set of energy dispersive x-ray spectroscopy (EDX) measurements is sufficient to experimentally evaluate the scattering function of electrons in high-angle annular dark field scanning transmission microscopy (HAADF-STEM). We then demonstrate how to use this function to transform qualitative HAADF-STEM images of InGaN layers into precise, quantitative chemical maps of the indium composition. The maps obtained in this way combine the resolution of HAADF-STEM and the chemical precision of EDX. We illustrate the potential of such chemical maps by using them to investigate nanometer-scale fluctuations in the indium composition and their impact on the growth of epitaxial InGaN layers. (paper)

Effect of the scale inhibitor on ion content in reverse osmosis system for seawater desalination

Science.gov (United States)

Gao, Yuhua; Liu, Zhenfa; Zhang, Lihui; Li, Haihua

2017-09-01

A scale inhibitor was synthesized from polysuccinimide with 2-aminoethanesulfonic acid and aspartic acid. The effect of scale inhibitor on ion content in reverse osmosis system for seawater desalination was studied. The results showed that the ion content of permeate water is lower with the scale inhibitor added in RO system for seawater desalination than without scale inhibitor. On the contrary, the ion content of concentrate water is higher when with scale inhibitor in RO system.

The Stanford-U.S. Geological Survey SHRIMP ion microprobe--a tool for micro-scale chemical and isotopic analysis

Science.gov (United States)

Bacon, Charles R.; Grove, Marty; Vazquez, Jorge A.; Coble, Matthew A.

2012-01-01

Answers to many questions in Earth science require chemical analysis of minute volumes of minerals, volcanic glass, or biological materials. Secondary Ion Mass Spectrometry (SIMS) is an extremely sensitive analytical method in which a 5–30 micrometer diameter "primary" beam of charged particles (ions) is focused on a region of a solid specimen to sputter secondary ions from 1–5 nanograms of the sample under high vacuum. The elemental abundances and isotopic ratios of these secondary ions are determined with a mass spectrometer. These results can be used for geochronology to determine the age of a region within a crystal thousands to billions of years old or to precisely measure trace abundances of chemical elements at concentrations as low as parts per billion. A partnership of the U.S. Geological Survey and the Stanford University School of Earth Sciences operates a large SIMS instrument, the Sensitive High-Resolution Ion Microprobe with Reverse Geometry (SHRIMP–RG) on the Stanford campus.

Ion beam assisted deposition of nano-structured C:Ni films

Energy Technology Data Exchange (ETDEWEB)

Abrasonis, G.; Muecklich, A.; Heller, R.; Heinig, K.H.; Gemming, S.; Moeller, W. [Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany); Krause, M. [Helmholtz-Zentrum Dresden-Rossendorf, Dresden (Germany); Institute of Physics, TU Dresden (Germany)

2012-07-01

Nanostructures influence material properties dramatically due to size, shape and interface effects. Thus the control of the structure at the nanoscale is a key issue in nanomaterials science. The interaction of hyperthermal ions with solids is confined to the nanometer scale. Thus, it can be used to control the morphology evolution during multiphase film deposition. Ion-induced displacements occur in a thin surface layer of the growing film where they increase the atomic mobility for the phase separation. Here the growth-structure relationship of C:Ni (15 at.%) nanocomposite films grown by oblique incidence (45 ) ion beam assisted deposition is reported. The influences of the flux of an assisting Ar+ ion beam (0-140 eV) as well as of an elevated substrate temperature have been studied. The formation of elongated nickel nanoparticles is strongly promoted by the ion beam assistance. Moreover, the metal nanocolumns no longer align with the advancing surface, but with the incoming ions. A window of conditions is established within which the ion assistance leads to the formation of regular composition modulations with a well defined periodicity and tilt. As the dominating driving force for the pattern formation is of physical origin, this approach might be applicable to other immiscible systems.

Direct observation and analysis of york-shell materials using low-voltage high-resolution scanning electron microscopy: Nanometal-particles encapsulated in metal-oxide, carbon, and polymer

Directory of Open Access Journals (Sweden)

Shunsuke Asahina

2014-11-01

Full Text Available Nanometal particles show characteristic features in chemical and physical properties depending on their sizes and shapes. For keeping and further enhancing their features, the particles should be protected from coalescence or degradation. One approach is to encapsulate the nanometal particles inside pores with chemically inert or functional materials, such as carbon, polymer, and metal oxides, which contain mesopores to allow permeation of only chemicals not the nanometal particles. Recently developed low-voltage high-resolution scanning electron microscopy was applied to the study of structural, chemical, and electron state of both nanometal particles and encapsulating materials in york-shell materials of Au@C, Ru/Pt@C, Au@TiO2, and Pt@Polymer. Progresses in the following categories were shown for the york-shell materials: (i resolution of topographic image contrast by secondary electrons, of atomic-number contrast by back-scattered electrons, and of elemental mapping by X-ray energy dispersive spectroscopy; (ii sample preparation for observing internal structures; and (iii X-ray spectroscopy such as soft X-ray emission spectroscopy. Transmission electron microscopy was also used for characterization of Au@C.

Scaling relations in elastic scattering cross sections between multiply charged ions and hydrogen

International Nuclear Information System (INIS)

Rodriguez, V.D.

1991-01-01

Differential elastic scattering cross sections of bare ions from hydrogen are calculated using the eikonal approximation. The results satisfy a scaling relation involving the scattering angle, the ion charge and a factor related to the ion mass. A semiclassical explanation in terms of a distant collision hypothesis for small scattering angle is proposed. A unified picture of related scaling rules found in direct processes is discussed. (author)

Analysis of trace elements by means of accelerator secondary ion mass spectrometry

International Nuclear Information System (INIS)

Ender, R.M.

1997-01-01

The analysis of material composition and trace element concentration is of increasing interest primarily in semiconductor technology but also in metallurgy, geology, biology and medicine. At present, Secondary Ion Mass Spectrometry (SIMS) is in many respects the best technique to provide 3-dimensional information on the distribution of trace elements with concentrations below 1 ppm. However, due to the presence of molecular ions the detectability of many trace elements it restricted because of molecular mass interferences. In addition, detectors used in SIMS have a background counting rate of 0.1-1 Hz, which further limits trace element analysis. In Accelerator Mass Spectrometry (AMS) long-lived radionuclides are detected free of molecular interferences and detector background at isotopic ratios as low as 10 -15 . Moreover, isobaric interferences can be reduced as well. In order to benefit from these advantages a combination of SIMS and AMS (Accelerator SIMS) has been proposed almost 20 years ago, but no facility has ever been fully developed. It has been the aim of this work to add a new sputtering chamber for AMS measurements of ultrapure semiconductor material to the existing PSI/ETH AMS facility. To fulfill the requirements of material analysis, an UHV chamber with special precautions against contamination has been built and adapted to the existing AMS setup. For sputtering, a commercial Cs gun with an ExB filter and a 1 o beam bend for neutral particle suppression is used to obtain a pure Cs ion beam. The gun is equipped with different apertures for varying the diameter of the beam spot. With the integrated scanning unit the 10 keV Cs beam can be rastered over approximately 1 mm 2 . This allows different applications such as bulk analysis, depth profiling and imaging. The secondary ion extraction is matched to the ion optical and geometrical requirements of the existing accelerator mass spectrometer. (author) figs., tabs., 67 refs

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

Science.gov (United States)

Martišíková, Mária; Jakubek, Jan; Granja, Carlos; Hartmann, Bernadette; Opálka, Lukáš; Pospíšil, Stanislav; Jäkel, Oliver

2011-11-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient`s condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2-30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

International Nuclear Information System (INIS)

Martišíková, Mária; Hartmann, Bernadette; Jäkel, Oliver; Jakubek, Jan; Granja, Carlos; Opálka, Lukáš; Pospíšil, Stanislav

2011-01-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient's condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2–30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

Shielding data for hadron-therapy ion accelerators: Attenuation of secondary radiation in concrete

CERN Document Server

Agosteo, S; Sagia, E; Silari, M

2014-01-01

The secondary radiation field produced by seven different ion species (from hydrogen to nitrogen), impinging onto thick targets made of either iron or ICRU tissue, was simulated with the FLUKA Monte Carlo code, and transported through thick concrete shields: the ambient dose equivalent was estimated and shielding parameters evaluated. The energy for each ion beam was set in order to reach a maximum penetration in ICRU tissue of 290 mm (equivalent to the therapeutic range of 430 MeV/amu carbon ions). Source terms and attenuation lengths are given as a function of emission angle and ion species, along with fits to the Monte Carlo data, for shallow depth and deep penetration in the shield. Trends of source terms and attenuation lengths as a function of neutron emission angle and ion species impinging on tar- get are discussed. A comparison of double differential distributions of neutrons with results from similar simulation works reported in the literature is also included. The aim of this work is to provide shi...

A high brightness source for nano-probe secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Smith, N.S. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)], E-mail: n.smith@oregon-physics.com; Tesch, P.P.; Martin, N.P.; Kinion, D.E. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)

2008-12-15

The two most prevalent ion source technologies in the field of surface analysis and surface machining are the Duoplasmatron and the liquid metal ion source (LMIS). There have been many efforts in this area of research to develop an alternative source [; N.S. Smith, W.P. Skoczylas, S.M. Kellogg, D.E. Kinion, P.P. Tesch, O. Sutherland, A. Aanesland, R.W. Boswell, J. Vac. Sci. Technol. B 24 (6) (2006) 2902-2906] with the brightness of a LMIS and yet the ability to produce secondary ion yield enhancing species such as oxygen. However, to date a viable alternative has not been realized. The high brightness and small virtual source size of the LMIS are advantageous for forming high resolution probes but a significant disadvantage when beam currents in excess of 100 nA are required, due to the effects of spherical aberration from the optical column. At these higher currents a source with a high angular intensity is optimal and in fact the relatively moderate brightness of today's plasma ion sources prevail in this operating regime. Both the LMIS and Duoplasmatron suffer from a large axial energy spread resulting in further limitations when forming focused beams at the chromatic limit where the figure-of-merit is inversely proportional to the square of the energy spread. Also, both of these ion sources operate with a very limited range of ion species. This article reviews some of the latest developments and some future potential in this area of instrument development. Here we present an approach to source development that could lead to oxygen ion beam SIMS imaging with 10 nm resolution, using a 'broad area' RF gas phase ion source.

Investigation of pUC19 DNA damage induced by direct and indirect effect of 7Li ions radiation

International Nuclear Information System (INIS)

Sui Li; Zhao Kui; Guo Jiyu; Ni Meinan; Kong Fuquan; Cai Minghui; Yang Mingjian

2006-01-01

The effect of direct and indirect action on DNA damage in 7 Li ions radiation is investigated. Using 7 Li ions generated by HI-13 tandem accelerator, three conditions of pUC19 plasmid DNA samples including dry, with or without mannitol are irradiated at different doses in air. These irradiated DNA samples are analyzed with atomic force microscopy (AFM) in nanometer-scale. The changes of DNA forms as the dose increases are observed. The results show that free radical is the main factor in DNA strand breaks induced by 7 Li ions radiation under condition of aqueous solution. The mannitol can effectively scavenge free radical and reduce the yields of DNA strand breaks. The experimental results of this report can offered valuable basal data for cancer therapy by boron neutron capture therapy (BNCT) or heavy ion radiation method, etc. (author)

Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment

International Nuclear Information System (INIS)

Stevie, F.A.; Kahora, P.M.; Simons, D.S.; Chi, P.

1988-01-01

Changes in secondary ion yields of matrix and dopant species have been correlated with changes in surface topography during O + 2 bombardment of Si and GaAs. In Si, profiles were measured in (100) wafers at 6- and 8-keV impact energy. At 6 keV, a yield increase of about 70% occurred for Si + over a depth range of 2.5 to 3.5 μm, with changes in other species ranging from a decrease of ∼20% for Si + 3 to an increase of more than 25% for O + . The development of a rippled surface topography was observed in scanning electron micrographs over the same depth range. Similar effects occurred over a 3--5 μm depth range for 8-keV ions, and in (111) silicon at a depth of 3 to 4 μm for 6-keV ions. No differences were noted between p- and n-type silicon, or implanted and unimplanted silicon. In GaAs, profiles were measured in (100) wafers at 2.5-, 5.5-, and 8-keV impact energies. At 8 keV, a yield increase of about 70% was found for GaO + in the range 0.6--1.0 μm, with smaller changes for other matrix species. At 5.5 keV, similar effects were observed, but over a depth interval of 0.3 to 0.7 μm. No yield changes were detected at 2.5-keV impact energy. The yield changes at the higher energies were again correlated with the onset of changes in topography. No change in ion yield or surface topography was noted for Cs + bombardment of Si or GaAs. The topography and ion yield changes are affected by the angle of incidence and, for Si, the oxygen coverage. The results show that the practice of normalizing secondary ion mass spectrometry dopant profiles to a matrix signal must be modified for situations where matrix yield changes occur

Quantum molecular dynamics study on energy transfer to the secondary electron in surface collision process of an ion

International Nuclear Information System (INIS)

Shibahara, M; Satake, S; Taniguchi, J

2008-01-01

In the present study the quantum molecular dynamics method was applied to an energy transfer problem to an electron during ionic surface collision process in order to elucidate how energy of ionic collision transfers to the emitted electrons. Effects of various physical parameters, such as the collision velocity and interaction strength between the observed electron and the classical particles on the energy transfer to the electron were investigated by the quantum molecular dynamics method when the potassium ion was collided with the surface so as to elucidate the energy path to the electron and the predominant factor of energy transfer to the electron. Effects of potential energy between the ion and the electron and that between the surface molecule and the electron on the electronic energy transfer were shown in the present paper. The energy transfer to the observed secondary electron through the potential energy term between the ion and the electron was much dependent on the ion collision energy although the energy increase to the observed secondary electron was not monotonous through the potential energy between the ion and surface molecules with the change of the ion collision energy

Application of secondary ions mass spectrometry (SIMS) in studies of internal contamination

International Nuclear Information System (INIS)

Amaral, Ademir; Galle, Pierre; Colas-Linhart, Nicole

2000-01-01

Secondary Ion Mass Spectrometry (SIMS) permits the detection of stable and radioactive nuclides. Based on the ablation of specimens by ion bombardment this mass spectrometry method allows a rapid assessment of trace elements in biological samples. Its resolving mass power provides an efficient analytical method and, in particular, it makes possible accurate isotopic ratio determination. In this work, the application of SIMS has been investigated in studies of internal contamination. In vivo studies were carried out using duodenal tissue sections from rats contaminated with cerium. Tests were performed to localize this element as a result of the contamination. In this report, analytical procedures and the potential of SIMS in biological research are presented and discussed. (author)

Ultrasensitive probing of the protein resistance of PEG surfaces by secondary ion mass spectrometry

DEFF Research Database (Denmark)

Kingshott, P.; McArthur, S.; Thissen, H.

2002-01-01

The highly sensitive surface analytical techniques X-ray photoelectron spectroscopy (XPS) and time-of-flight static secondary ion mass spectrometry (ToF-SIMS) were used to test the resistance of poly(ethylene glycol) (PEG) coatings towards adsorption of lysozyme (LYS) and fibronectin (FN). PEG co...

Radioactive heavy ion secondary beams

International Nuclear Information System (INIS)

Bimbot, R.

1987-01-01

The production of secondary radioactive beams at GANIL using the LISE spectrometer is reviewed. The experimental devices, and secondary beam characteristics are summarized. Production of neutron rich secondary beams was studied for the systems Ar40 + Be at 44 MeV/u, and 018 + Be at 45 and 65 MeV/u. Partial results were also obtained for the system Ne22 + Ta at 45 MeV/u. Experiments using secondary beams are classified into two categories: those which correspond to fast transfer of nuclei from the production target to a well shielded observation point; and those in which the radioactive beam interacts with a secondary target

A simple and rapid method for high-resolution visualization of single-ion tracks

Directory of Open Access Journals (Sweden)

Masaaki Omichi

2014-11-01

Full Text Available Prompt determination of spatial points of single-ion tracks plays a key role in high-energy particle induced-cancer therapy and gene/plant mutations. In this study, a simple method for the high-resolution visualization of single-ion tracks without etching was developed through the use of polyacrylic acid (PAA-N, N’-methylene bisacrylamide (MBAAm blend films. One of the steps of the proposed method includes exposure of the irradiated films to water vapor for several minutes. Water vapor was found to promote the cross-linking reaction of PAA and MBAAm to form a bulky cross-linked structure; the ion-track scars were detectable at a nanometer scale by atomic force microscopy. This study demonstrated that each scar is easily distinguishable, and the amount of generated radicals of the ion tracks can be estimated by measuring the height of the scars, even in highly dense ion tracks. This method is suitable for the visualization of the penumbra region in a single-ion track with a high spatial resolution of 50 nm, which is sufficiently small to confirm that a single ion hits a cell nucleus with a size ranging between 5 and 20 μm.

A simple and rapid method for high-resolution visualization of single-ion tracks

Energy Technology Data Exchange (ETDEWEB)

Omichi, Masaaki [Department of Applied Chemistry, Graduate School of Engineering, Osaka University, Osaka 565-0871 (Japan); Center for Collaborative Research, Anan National College of Technology, Anan, Tokushima 774-0017 (Japan); Choi, Wookjin; Sakamaki, Daisuke; Seki, Shu, E-mail: seki@chem.eng.osaka-u.ac.jp [Department of Applied Chemistry, Graduate School of Engineering, Osaka University, Osaka 565-0871 (Japan); Tsukuda, Satoshi [Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi 980-8577 (Japan); Sugimoto, Masaki [Japan Atomic Energy Agency, Takasaki Advanced Radiation Research Institute, Gunma, Gunma 370-1292 (Japan)

2014-11-15

Prompt determination of spatial points of single-ion tracks plays a key role in high-energy particle induced-cancer therapy and gene/plant mutations. In this study, a simple method for the high-resolution visualization of single-ion tracks without etching was developed through the use of polyacrylic acid (PAA)-N, N’-methylene bisacrylamide (MBAAm) blend films. One of the steps of the proposed method includes exposure of the irradiated films to water vapor for several minutes. Water vapor was found to promote the cross-linking reaction of PAA and MBAAm to form a bulky cross-linked structure; the ion-track scars were detectable at a nanometer scale by atomic force microscopy. This study demonstrated that each scar is easily distinguishable, and the amount of generated radicals of the ion tracks can be estimated by measuring the height of the scars, even in highly dense ion tracks. This method is suitable for the visualization of the penumbra region in a single-ion track with a high spatial resolution of 50 nm, which is sufficiently small to confirm that a single ion hits a cell nucleus with a size ranging between 5 and 20 μm.

Feasibility of carbon-ion radiotherapy for re-irradiation of locoregionally recurrent, metastatic, or secondary lung tumors.

Science.gov (United States)

Hayashi, Kazuhiko; Yamamoto, Naoyoshi; Karube, Masataka; Nakajima, Mio; Tsuji, Hiroshi; Ogawa, Kazuhiko; Kamada, Tadashi

2018-03-02

Intrathoracic recurrence after carbon-ion radiotherapy for primary or metastatic lung tumors remains a major cause of cancer-related deaths. However, treatment options are limited. Herein, we report on the toxicity and efficacy of re-irradiation with carbon-ion radiotherapy for locoregionally recurrent, metastatic, or secondary lung tumors. Data of 95 patients with prior intrathoracic carbon-ion radiotherapy who were treated with re-irradiation with carbon-ion radiotherapy at our institution between 2006 and 2016 were retrospectively analyzed. Seventy-three patients (76.8%) had primary lung tumors and 22 patients (23.2%) had metastatic lung tumors. The median dose of initial carbon-ion radiotherapy was 52.8 Gy (relative biological effectiveness) and the median dose of re-irradiation was 66.0 Gy (relative biological effectiveness). None of the patients received concurrent chemotherapy. The median follow-up period after re-irradiation was 18 months. In terms of grade ≥3 toxicities, one patient experienced each of the following: grade 5 bronchopleural fistula, grade 4 radiation pneumonitis, grade 3 chest pain, and grade 3 radiation pneumonitis. The 2-year local control and overall survival rates were 54.0% and 61.9%, respectively. In conclusion, re-irradiation with carbon-ion radiotherapy was associated with relatively low toxicity and moderate efficacy. Re-irradiation with carbon-ion radiotherapy might be an effective treatment option for patients with locoregionally recurrent, metastatic, or secondary lung tumors. © 2018 The Authors. Cancer Science published by John Wiley & Sons Australia, Ltd on behalf of Japanese Cancer Association.

Split Bull's eye shaped aluminum antenna for plasmon-enhanced nanometer scale germanium photodetector.

Science.gov (United States)

Ren, Fang-Fang; Ang, Kah-Wee; Ye, Jiandong; Yu, Mingbin; Lo, Guo-Qiang; Kwong, Dim-Lee

2011-03-09

Bull's eye antennas are capable of efficiently collecting and concentrating optical signals into an ultrasmall area, offering an excellent solution to break the bottleneck between speed and photoresponse in subwavelength photodetectors. Here, we exploit the idea of split bull's eye antenna for a nanometer germanium photodetector operating at a standard communication wavelength of 1310 nm. The nontraditional plasmonic metal aluminum has been implemented in the resonant antenna structure fabricated by standard complementary metal-oxide-semiconductor (CMOS) processing. A significant enhancement in photoresponse could be achieved over the conventional bull's eye scheme due to an increased optical near-field in the active region. Moreover, with this novel antenna design the effective grating area could be significantly reduced without sacrificing device performance. This work paves the way for the future development of low-cost, high-density, and high-speed CMOS-compatible germanium-based optoelectronic devices.

Electrochemical lithiation of silicon electrodes. Neutron reflectometry and secondary ion mass spectrometry investigations

Energy Technology Data Exchange (ETDEWEB)

Jerliu, Bujar; Doerrer, Lars; Hueger, Erwin [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Seidlhofer, Beatrix-Kamelia; Steitz, Roland [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Borchardt, Guenter; Schmidt, Harald [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Clausthaler Zentrum fuer Materialtechnik (CZM), Clausthal-Zellerfeld (Germany)

2017-11-15

In-situ neutron reflectometry and ex-situ secondary ion mass spectrometry in combination with electrochemical methods were used to study the lithiation of amorphous silicon electrodes. For that purpose specially designed closed three-electrode electrochemical cells with thin silicon films as the working electrode and lithium as counter and reference electrodes were used. The neutron reflectometry results obtained in-situ during galvanostatic cycling show that the incorporation, redistribution and removal of Li in amorphous silicon during a lithiation cycle can be monitored. It was possible to measure the volume modification during lithiation, which is found to be rather independent of cycle number, current density and film thickness and in good agreement with first-principles calculations as given in literature. Indications for an inhomogeneous lithiation mechanism were found by secondary ion mass spectrometry measurements. Lithium tracer diffusion experiments indicate that the diffusivities inside the lithiated region (D > 10{sup -15} m{sup 2} s{sup -1}) are considerably higher than in pure amorphous silicon as known from literature. This suggests a kinetics based explanation for the occurrence of an inhomogeneous lithiation mechanism.

Graphene nanoribbon field effect transistor for nanometer-size on-chip temperature sensor

Science.gov (United States)

Banadaki, Yaser M.; Srivastava, Ashok; Sharifi, Safura

2016-04-01

Graphene has been extensively investigated as a promising material for various types of high performance sensors due to its large surface-to-volume ratio, remarkably high carrier mobility, high carrier density, high thermal conductivity, extremely high mechanical strength and high signal-to-noise ratio. The power density and the corresponding die temperature can be tremendously high in scaled emerging technology designs, urging the on-chip sensing and controlling of the generated heat in nanometer dimensions. In this paper, we have explored the feasibility of a thin oxide graphene nanoribbon (GNR) as nanometer-size temperature sensor for detecting local on-chip temperature at scaled bias voltages of emerging technology. We have introduced an analytical model for GNR FET for 22nm technology node, which incorporates both thermionic emission of high-energy carriers and band-to-band-tunneling (BTBT) of carriers from drain to channel regions together with different scattering mechanisms due to intrinsic acoustic phonons and optical phonons and line-edge roughness in narrow GNRs. The temperature coefficient of resistivity (TCR) of GNR FET-based temperature sensor shows approximately an order of magnitude higher TCR than large-area graphene FET temperature sensor by accurately choosing of GNR width and bias condition for a temperature set point. At gate bias VGS = 0.55 V, TCR maximizes at room temperature to 2.1×10-2 /K, which is also independent of GNR width, allowing the design of width-free GNR FET for room temperature sensing applications.

[Electronic and structural properties of individual nanometer-size supported metallic clusters

International Nuclear Information System (INIS)

Reifenberger, R.

1993-01-01

This report summarizes the work performed under contract DOE-FCO2-84ER45162. During the past ten years, our study of electron emission from laser-illuminated field emission tips has taken on a broader scope by addressing problems of direct interest to those concerned with the unique physical and chemical properties of nanometer-size clusters. The work performed has demonstrated that much needed data can be obtained on individual nanometer-size clusters supported on a wide-variety of different substrates. The work was performed in collaboration with R.P. Andres in the School of Chemical Engineering at Purdue University. The Multiple Expansion Cluster Source developed by Andres and his students was essential for producing the nanometer-size clusters studied. The following report features a discussion of these results. This report provides a motivation for studying the properties of nanometer-size clusters and summarizes the results obtained

High energy Xe{sup +} ion beam induced ripple structures on silicon

Energy Technology Data Exchange (ETDEWEB)

Hanisch, Antje; Grenzer, Joerg; Facsko, Stefan; Winkler, Ingolf [Forschungszentrum Dresden-Rossendorf, Institute for Ion Beam Physics and Materials Research, Dresden (Germany); Biermanns, Andreas; Grigorian, Souren; Pietsch, Ullrich [University of Siegen (Germany). Institute of Physics

2008-07-01

Ion beam bombardment on semiconductor surfaces leads to well-defined morphological structures in the nanoscale range. Due to the impact of ions a self-organized wave-like surface structure develops. Ion bombardment causes an amorphization of a surface-adjacent layer of several nanometers and creates a periodical structure on the surface as well as at the amorphous-crystalline interface. We investigate the dependence of the periodicity on the crystallography of (100) silicon bombarded with Xe{sup +} ions, the ion beam incidence and the azimutal angle of the sample surface. So far we found that the ripple wavelength scales with the ion energy in a range of 5 to 70 keV. In order to understand the initiation of the ripple formation we also ask the question which role the initial surface structure plays. Therefore we investigate the formation of ripples on pre-structured and rough surfaces such as wafers with an intentional miscut. Therefore, we not only introduce a certain initial roughness but also vary the orientation of the (100) lattice plane in respect to the surface. We distinguish between ion beam induced surface effects (sputter erosion) and the influence of the crystalline Si lattice (strain) on the ripple formation.

The Structure and Transport of Water and Hydrated Ions Within Hydrophobic, Nanoscale Channels

International Nuclear Information System (INIS)

Holt, J.K.; Herberg, J.L.; Wu, Y.; Schwegler, E.; Mehta, A.

2009-01-01

The purpose of this project includes an experimental and modeling investigation into water and hydrated ion structure and transport at nanomaterials interfaces. This is a topic relevant to understanding the function of many biological systems such as aquaporins that efficiently shuttle water and ion channels that permit selective transport of specific ions across cell membranes. Carbon nanotubes (CNT) are model nanoscale, hydrophobic channels that can be functionalized, making them artificial analogs for these biological channels. This project investigates the microscopic properties of water such as water density distributions and dynamics within CNTs using Nuclear Magnetic Resonance (NMR) and the structure of hydrated ions at CNT interfaces via X-ray Absorption Spectroscopy (XAS). Another component of this work is molecular simulation, which can predict experimental measurables such as the proton relaxation times, chemical shifts, and can compute the electronic structure of CNTs. Some of the fundamental questions this work is addressing are: (1) what is the length scale below which nanoscale effects such as molecular ordering become important, (2) is there a relationship between molecular ordering and transport?, and (3) how do ions interact with CNT interfaces? These are questions of interest to the scientific community, but they also impact the future generation of sensors, filters, and other devices that operate on the nanometer length scale. To enable some of the proposed applications of CNTs as ion filtration media and electrolytic supercapacitors, a detailed knowledge of water and ion structure at CNT interfaces is critical.

Analysis of As implantation profiles in silica by nuclear microanalysis and secondary ion emission

International Nuclear Information System (INIS)

Dieumegard, D.; Croset, M.; Cohen, C.; Lhoir, A.; Rigo, S.; Chaumont, J.

1974-01-01

Results obtained from analysis using, either the method of elastic backscattering of light or semi-heavy ions ( 4 He + , 14 N + ) about one MeV energy, or the secondary ion emission method are compared. The choice of As implanted Si is explained by the following reasons: As is an element relatively heavy in comparison with Si, that allows an analysis to be effected on a few thousands Angstroems depth in silica using elastic backscattering; the silica chosen as substrate being an amorphous material allows channeling phenomena to the avoided during implantation and analysis [fr

Enhancement of the secondary ion emission from Si by O/sub 2 and H/sub 2/O adsorption

International Nuclear Information System (INIS)

Huan, C.H.; Wee, A.T.S.; Tan, K.L.

1992-01-01

The positive and negative secondary ion emission of Si are examined as a function of O/sub 2 and H/sub 2/O surface coverage under conditions of simultaneous adsorption and Ar/sup+ ion bombardment. It is found that the ion-molecule mechanism accounts for the adsorbate-induced signals and that yield enhancement by H/sub 2/O adsorption is less effective than O/sub 2 adsorption. (authors)

Sub-nanometer periodic nonlinearity error in absolute distance interferometers

Science.gov (United States)

Yang, Hongxing; Huang, Kaiqi; Hu, Pengcheng; Zhu, Pengfei; Tan, Jiubin; Fan, Zhigang

2015-05-01

Periodic nonlinearity which can result in error in nanometer scale has become a main problem limiting the absolute distance measurement accuracy. In order to eliminate this error, a new integrated interferometer with non-polarizing beam splitter is developed. This leads to disappearing of the frequency and/or polarization mixing. Furthermore, a strict requirement on the laser source polarization is highly reduced. By combining retro-reflector and angel prism, reference and measuring beams can be spatially separated, and therefore, their optical paths are not overlapped. So, the main cause of the periodic nonlinearity error, i.e., the frequency and/or polarization mixing and leakage of beam, is eliminated. Experimental results indicate that the periodic phase error is kept within 0.0018°.

Investigation of chemical changes in uranium oxyfluoride particles using secondary ion mass spectrometry

International Nuclear Information System (INIS)

Kips, R.S.; Kristo, M.J.

2009-01-01

Understanding how environmental conditions may affect sample composition is critical to the interpretation of laboratory analyses from environmental sampling. We prepared a set of UO 2 F 2 particle samples from the hydrolysis of UF 6 and stored these samples in environmental chambers at different temperature, humidity and lighting conditions. The NanoSIMS ion microprobe was used to measure the UF + /U + secondary ion ratio of individual particles. Monitoring variations in this ratio may provide insights on changes in particle composition over time and in response to environmental exposure. This report presents the baseline measurements carried out on freshly-prepared particle samples to determine the initial amount of fluorine. (author)

Analysis of intensities of positive and negative ion species from silicon dioxide films using time-of-flight secondary ion mass spectrometry and electronegativity of fragments

International Nuclear Information System (INIS)

Chiba, Kiyoshi

2010-01-01

Intensities of positive and negative ion species emitted from thermally oxidized and plasma-enhanced chemical vapor deposited (PECVD) SiO 2 films were analyzed using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and the Saha-Boltzmann equation. Intensities of positive and negative secondary ion species were normalized to those of 28 Si + and 28 Si - ions, respectively, and an effective temperature of approximately (7.2 ± 0.1) x 10 3 K of the sputtered region bombarded with pulsed 22 kV Au 3 + primary ions was determined. Intensity spectra showed polarity dependence on both n and m values of Si n O m fragments, and a slight shift to negative polarity for PECVD SiO 2 compared to thermally oxidized SiO 2 films. By dividing the intensity ratios of negative-to-positive ions for PECVD SiO 2 by those for thermally oxidized SiO 2 films to cancel statistical factors, the difference in absolute electronegativity (half the sum of ionization potential and electron affinity of fragments) between both films was obtained. An increase in electronegativity for SiO m (m = 1, 2) and Si 2 O m (m = 1-4) fragments for PECVD SiO 2 films compared to thermally oxidized films was obtained to be 0.1-0.2 Pauling units, indicating a more covalent nature of Si-O bonds for PECVD SiO 2 films compared to the thermally oxidized SiO 2 films.

Stopping characteristics of boron and indium ions in silicon

Energy Technology Data Exchange (ETDEWEB)

Veselov, D. S., E-mail: DSVeselov@mephi.ru; Voronov, Yu. A. [National Research Nuclear University MEPhI (Russian Federation)

2016-12-15

The mean range and its standard deviation are calculated for boron ions implanted into silicon with energies below 10 keV. Similar characteristics are calculated for indium ions with energies below 200 keV. The obtained results are presented in tabular and graphical forms. These results may help in the assessment of conditions of production of integrated circuits with nanometer-sized elements.

An RF ion source based primary ion gun for secondary ion mass spectroscopy

International Nuclear Information System (INIS)

Menon, Ranjini; Nabhiraj, P.Y.; Bhandari, R.K.

2011-01-01

In this article we present the design, development and characterization of an RF plasma based ion gun as a primary ion gun for SIMS application. RF ion sources, in particular Inductively Coupled Plasma (ICP) ion sources are superior compared to LMIS and duoplasmtron ion sources since they are filamentless, can produce ions of gaseous elements. At the same time, ICP ion sources offer high angular current density which is an important factor in producing high current in small spot size on the target. These high current microprobes improve the signal to noise ratio by three orders as compared to low current ion sources such as LMIS. In addition, the high current microprobes have higher surface and depth profiling speeds. In this article we describe a simple ion source in its very basic form, two lens optical column and characteristics of microprobe

Development of methodics for the characterization of the composition of the ion-collision-induced secondary-particle flux by comparison of the yield contributions of photoinduced ion formation processes

International Nuclear Information System (INIS)

Vering, Guido

2008-01-01

The aim of this work was to develop a method to distinguish between different ion formation processes and to determine the influence of these processes on the total number of detected monatomic ions of a certain element. A vector/matrix-formalism was developed, which describes the physical processes of sputtering, ion formation, mass separation and detection in laser-SNMS. In the framework of the method developed, based on this theoretic formalism, changes in the secondary flux contribution of the respective element were observed by comparing the detected monatomic ion yield obtained in specifically aligned (SIMS and) laser-SNMS experiments. The yields resulting from these experiments were used to calculate characteristic numbers to compare the flux composition from different surfaces. The potential of the method was demonstrated for the elements boron, iron and gadolinium by investigating the changes in the flux composition of secondary particles sputtered from metallic surfaces, as a function of the oxygen concentration at the surface. Finally, combined laser-SNMS depth profiles and images, obtained with both laser systems, were presented to demonstrate how the parallel detection of the three differently originated ion signals of the same element can be used to get additional information about the composition of the flux of secondary particles synchronously during the analysis of elemental distributions. In this respect the presented method can be a very helpful tool to prevent misleading interpretations of SIMS or laser-SNMS data. (orig.)

Secondary ion shadow-cone enhanced desorption

Energy Technology Data Exchange (ETDEWEB)

Chechen Chang (Hawaii Univ., Honolulu (USA). Dept. of Chemistry)

1990-02-01

The incident angle dependence of the secondary particle emission process under keV ion bombardment has been investigated. The results from the full molecular dynamics calculations indicate that the flux anisotropy of the incident beam, resulting from the non-uniform impact parameters for the surface atom of a single crystal, affects the particle desorption in a systematic fashion. The enhanced desorption at certain angles of incidence corresponds to the intensive focusing of the incident beam to the near-surface atom and the extended dissipation of momentum by large-angle scattering. This observation has let us to develop a new theoretical model in which the enhanced desorption is described by the distance of closest encounter along the trajectory of the incident particle to the surface atom. The computer time for the simulation of the incident-angle-dependent emission process is significantly reduced. The results from the calculation based on this model are in good agreement both with the results from the full dynamics calculation and with the experimental results. The new model also allows a complementary evaluation of the microscopic dynamics involved in the shadow-cone enhanced desorption. (author).

Magnetic Reconnection May Control the Ion-scale Spectral Break of Solar Wind Turbulence

Science.gov (United States)

Vech, Daniel; Mallet, Alfred; Klein, Kristopher G.; Kasper, Justin C.

2018-03-01

The power spectral density of magnetic fluctuations in the solar wind exhibits several power-law-like frequency ranges with a well-defined break between approximately 0.1 and 1 Hz in the spacecraft frame. The exact dependence of this break scale on solar wind parameters has been extensively studied but is not yet fully understood. Recent studies have suggested that reconnection may induce a break in the spectrum at a “disruption scale” {λ }{{D}}, which may be larger than the fundamental ion kinetic scales, producing an unusually steep spectrum just below the break. We present a statistical investigation of the dependence of the break scale on the proton gyroradius ρ i , ion inertial length d i , ion sound radius ρ s , proton–cyclotron resonance scale ρ c , and disruption scale {λ }{{D}} as a function of {β }\\perp i. We find that the steepest spectral indices of the dissipation range occur when β e is in the range of 0.1–1 and the break scale is only slightly larger than the ion sound scale (a situation occurring 41% of the time at 1 au), in qualitative agreement with the reconnection model. In this range, the break scale shows a remarkably good correlation with {λ }{{D}}. Our findings suggest that, at least at low β e , reconnection may play an important role in the development of the dissipation range turbulent cascade and cause unusually steep (steeper than ‑3) spectral indices.

Performance predictions of a focused ion beam from a laser cooled and compressed atomic beam

Energy Technology Data Exchange (ETDEWEB)

Haaf, G. ten; Wouters, S. H. W.; Vredenbregt, E. J. D.; Mutsaers, P. H. A. [Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands); Geer, S. B. van der [Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven (Netherlands); Pulsar Physics, Burghstraat 47, 5614 BC Eindhoven (Netherlands)

2014-12-28

Focused ion beams are indispensable tools in the semiconductor industry because of their ability to image and modify structures at the nanometer length scale. Here, we report on performance predictions of a new type of focused ion beam based on photo-ionization of a laser cooled and compressed atomic beam. Particle tracing simulations are performed to investigate the effects of disorder-induced heating after ionization in a large electric field. They lead to a constraint on this electric field strength which is used as input for an analytical model which predicts the minimum attainable spot size as a function of, amongst others, the flux density of the atomic beam, the temperature of this beam, and the total current. At low currents (I < 10 pA), the spot size will be limited by a combination of spherical aberration and brightness, while at higher currents, this is a combination of chromatic aberration and brightness. It is expected that a nanometer size spot is possible at a current of 1 pA. The analytical model was verified with particle tracing simulations of a complete focused ion beam setup. A genetic algorithm was used to find the optimum acceleration electric field as a function of the current. At low currents, the result agrees well with the analytical model, while at higher currents, the spot sizes found are even lower due to effects that are not taken into account in the analytical model.

Large scale silver nanowires network fabricated by MeV hydrogen (H+) ion beam irradiation

International Nuclear Information System (INIS)

S, Honey; S, Naseem; A, Ishaq; M, Maaza; M T, Bhatti; D, Wan

2016-01-01

A random two-dimensional large scale nano-network of silver nanowires (Ag-NWs) is fabricated by MeV hydrogen (H + ) ion beam irradiation. Ag-NWs are irradiated under H +  ion beam at different ion fluences at room temperature. The Ag-NW network is fabricated by H + ion beam-induced welding of Ag-NWs at intersecting positions. H +  ion beam induced welding is confirmed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM). Moreover, the structure of Ag NWs remains stable under H +  ion beam, and networks are optically transparent. Morphology also remains stable under H +  ion beam irradiation. No slicings or cuttings of Ag-NWs are observed under MeV H +  ion beam irradiation. The results exhibit that the formation of Ag-NW network proceeds through three steps: ion beam induced thermal spikes lead to the local heating of Ag-NWs, the formation of simple junctions on small scale, and the formation of a large scale network. This observation is useful for using Ag-NWs based devices in upper space where protons are abandoned in an energy range from MeV to GeV. This high-quality Ag-NW network can also be used as a transparent electrode for optoelectronics devices. (paper)

Comprehensive Enhancement of Nanostructured Lithium-Ion Battery Cathode Materials via Conformal Graphene Dispersion.

Science.gov (United States)

Chen, Kan-Sheng; Xu, Rui; Luu, Norman S; Secor, Ethan B; Hamamoto, Koichi; Li, Qianqian; Kim, Soo; Sangwan, Vinod K; Balla, Itamar; Guiney, Linda M; Seo, Jung-Woo T; Yu, Xiankai; Liu, Weiwei; Wu, Jinsong; Wolverton, Chris; Dravid, Vinayak P; Barnett, Scott A; Lu, Jun; Amine, Khalil; Hersam, Mark C

2017-04-12

Efficient energy storage systems based on lithium-ion batteries represent a critical technology across many sectors including consumer electronics, electrified transportation, and a smart grid accommodating intermittent renewable energy sources. Nanostructured electrode materials present compelling opportunities for high-performance lithium-ion batteries, but inherent problems related to the high surface area to volume ratios at the nanometer-scale have impeded their adoption for commercial applications. Here, we demonstrate a materials and processing platform that realizes high-performance nanostructured lithium manganese oxide (nano-LMO) spinel cathodes with conformal graphene coatings as a conductive additive. The resulting nanostructured composite cathodes concurrently resolve multiple problems that have plagued nanoparticle-based lithium-ion battery electrodes including low packing density, high additive content, and poor cycling stability. Moreover, this strategy enhances the intrinsic advantages of nano-LMO, resulting in extraordinary rate capability and low temperature performance. With 75% capacity retention at a 20C cycling rate at room temperature and nearly full capacity retention at -20 °C, this work advances lithium-ion battery technology into unprecedented regimes of operation.

RF Circuit Design in Nanometer CMOS

NARCIS (Netherlands)

Nauta, Bram

2007-01-01

With CMOS technology entering the nanometer regime, the design of analog and RF circuits is complicated by low supply voltages, very non-linear (and nonquadratic) devices and large 1/f noise. At the same time, circuits are required to operate over increasingly wide bandwidths to implement modern

Alpha spectrometry and the secondary ion mass spectrometry of thorium

International Nuclear Information System (INIS)

Strisovska, J.; Kuruc, J.; Galanda, D.; Matel, L.; Aranyosiova, M.; Velic, D.

2009-01-01

The main objective of this master thesis was preparation of samples with thorium content on the steel discs by electrodeposition for determination of natural thorium isotope by alpha spectrometry and the secondary ion mass spectrometry and finding out their possible linear correlation between these methods. The samples with electrolytically excluded isotope of 232 Th were prepared by electrodeposition from solution Th(NO 3 ) 4 ·12 H2 O on steel discs in electrodeposition cell with use of solutions Na 2 SO 4 , NaHSO 4 , KOH and (NH 4 ) 2 (C 2 O 4 ) by electric current 0.75 A. Discs were measured by alpha spectrometer. Activity was calculated from the registered impulses for 232 Th and surface's weight. After alpha spectrometry measurements discs were analyzed by TOF-SIMS IV which is installed in the International Laser Centre in Bratislava. Intensities of isotope of 232 Th and ions of ThO + , ThOH + , ThO 2 H + , Th 2 O 4 H + , ThO 2 - , ThO 3 H - , ThH 3 O 3 - and ThN 2 O 5 H - were identified. The linear correlation is between surface's weights of Th and intensities of ions of Th + from SIMS, however the correlation coefficient has relatively low value. We found out with SIMS method that oxidized and hydride forms of thorium are significantly represented in samples with electroplated thorium. (authors)

Development of nano-structure controlled polymer electrolyte fuel-cell membranes by high-energy heavy ion irradiation

International Nuclear Information System (INIS)

Yamaki, Tetsuya; Asano, Masaharu; Maekawa, Yasunari; Yoshida, Masaru; Kobayashi, Misaki; Nomura, Kumiko; Takagi, Shigeharu

2008-01-01

There is increasing interest in polymer electrolyte fuel cells (PEFCs) together with recent worldwide energy demand and environmental issues. In order to develop proton-conductive membranes for PEFCs, we have been using high-energy heavy ion beams from the cyclotron accelerator of Takasaki Ion Accelerators for Advanced Radiation Application (TIARA), JAEA. Our strategic focus is centered on using nano-scale controllability of the ion-beam processing; the membrane preparation involves (1) the irradiation of commercially-available base polymer films with MeV ions, (2) graft polymerization of vinyl monomers into electronically-excited parts along the ion trajectory, called latent tracks, and (3) sulfonation of the graft polymers. Interestingly, the resulting membranes exhibited anisotropic proton transport, i.e., higher conductivity in the thickness direction. According to microscopic observations, this is probably because the columnar electrolyte phase extended, with a width of tens-to-hundreds nanometers, through the membrane. Other excellent membrane properties, e.g., sufficient mechanical strength, high dimensional stability, and low gas permeability should be due to such a controlled structure. (author)

Self-assembled LiFePO4 nanowires with high rate capability for Li-ion batteries.

Science.gov (United States)

Peng, Lele; Zhao, Yu; Ding, Yu; Yu, Guihua

2014-08-28

Controlling the dimensions in the nanometer scale of olivine-type LiFePO4 has been regarded as one of the most effective strategies to improve its electrochemical performance for Li-ion batteries. In this communication, we demonstrate a novel LiFePO4 nanoarchitecture, which is composed of self-assembled single-crystalline nanowires and exhibits good rate capability with a reversible capacity of ∼110 mA h g(-1) at a current rate of 30 C, and a stable capacity retention of ∼86% after 1000 cycles at a current rate of 10 C.

Secondary electron emission in nanostructured porous silicon

Energy Technology Data Exchange (ETDEWEB)

Ruano, G D; Ferron, J; Koropecki, R R, E-mail: gdruano@ceride.gov.a [INTEC-UNL-CONICET, Gueemes 3450 - 3000 Santa Fe (Argentina)

2009-05-01

We studied the reversible reduction induced by ion bombardment of the secondary electron emission (SEE) yield. This effect has been modelled as due to changes in dynamically sustained dipoles related with ions and electrons penetration ranges. Such charge configuration precludes the escape of electrons from the nanoporous silicon, making the SEE dependent on the flux of impinging ions. Since this dipolar momentum depends on the electric conduction of the porous medium, by controlled oxidation of the nanoporous structure we change the conduction features of the sample, studying the impact on the SEE reduction effect. Li ion bombardment was also used with the intention of changing the parameters determining the effect. FT-IR and Auger electron spectroscopy were used to characterize the oxidation degree of the samples at different depth scales

Numerical assessment of the ion turbulent thermal transport scaling laws

International Nuclear Information System (INIS)

Ottaviani, M.; Manfredi, G.

2001-01-01

Numerical simulations of ion temperature gradient (ITG) driven turbulence were carried out to investigate the parametric dependence of the ion thermal transport on the reduced gyroradius and on the local safety factor. Whereas the simulations show a clear proportionality of the conductivity to the gyroradius, the dependence on the safety factor cannot be represented as a simple power law like the one exhibited by the empirical scaling laws. (author)

COHERENT EVENTS AND SPECTRAL SHAPE AT ION KINETIC SCALES IN THE FAST SOLAR WIND TURBULENCE

Energy Technology Data Exchange (ETDEWEB)

Lion, Sonny; Alexandrova, Olga; Zaslavsky, Arnaud, E-mail: sonny.lion@obspm.fr [LESIA, Observatoire de Paris, PSL Research University, CNRS, Sorbonne Universités, UPMC Univ. Paris 06, Univ. Paris Diderot, Sorbonne Paris Cité (France)

2016-06-10

In this paper we investigate spectral and phase coherence properties of magnetic fluctuations in the vicinity of the spectral transition from large, magnetohydrodynamic to sub-ion scales using in situ measurements of the Wind spacecraft in a fast stream. For the time interval investigated by Leamon et al. (1998) the phase coherence analysis shows the presence of sporadic quasi-parallel Alfvén ion cyclotron (AIC) waves as well as coherent structures in the form of large-amplitude, quasi-perpendicular Alfvén vortex-like structures and current sheets. These waves and structures importantly contribute to the observed power spectrum of magnetic fluctuations around ion scales; AIC waves contribute to the spectrum in a narrow frequency range whereas the coherent structures contribute to the spectrum over a wide frequency band from the inertial range to the sub-ion frequency range. We conclude that a particular combination of waves and coherent structures determines the spectral shape of the magnetic field spectrum around ion scales. This phenomenon provides a possible explanation for a high variability of the magnetic power spectra around ion scales observed in the solar wind.

COHERENT EVENTS AND SPECTRAL SHAPE AT ION KINETIC SCALES IN THE FAST SOLAR WIND TURBULENCE

International Nuclear Information System (INIS)

Lion, Sonny; Alexandrova, Olga; Zaslavsky, Arnaud

2016-01-01

In this paper we investigate spectral and phase coherence properties of magnetic fluctuations in the vicinity of the spectral transition from large, magnetohydrodynamic to sub-ion scales using in situ measurements of the Wind spacecraft in a fast stream. For the time interval investigated by Leamon et al. (1998) the phase coherence analysis shows the presence of sporadic quasi-parallel Alfvén ion cyclotron (AIC) waves as well as coherent structures in the form of large-amplitude, quasi-perpendicular Alfvén vortex-like structures and current sheets. These waves and structures importantly contribute to the observed power spectrum of magnetic fluctuations around ion scales; AIC waves contribute to the spectrum in a narrow frequency range whereas the coherent structures contribute to the spectrum over a wide frequency band from the inertial range to the sub-ion frequency range. We conclude that a particular combination of waves and coherent structures determines the spectral shape of the magnetic field spectrum around ion scales. This phenomenon provides a possible explanation for a high variability of the magnetic power spectra around ion scales observed in the solar wind.

Displacement laser interferometry with sub-nanometer uncertainty

NARCIS (Netherlands)

Cosijns, S.J.A.G.

2004-01-01

Development in industry is asking for improved resolution and higher accuracy in mechanical measurement. Together with miniaturization the demand for sub nanometer uncertainty on dimensional metrology is increasing rapidly. Displacement laser interferometers are used widely as precision displacement

Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

Science.gov (United States)

Vanbellingen, Quentin P.; Elie, Nicolas; Eller, Michael J.; Della‐Negra, Serge; Touboul, David

2015-01-01

Rationale In Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and focused primary ion beams enable mass spectrometry imaging, a method which is particularly useful to map various small molecules such as lipids at the surface of biological samples. When using TOF‐SIMS instruments, the focusing modes of the primary ion beam delivered by liquid metal ion guns can provide either a mass resolution of several thousand or a sub‐µm lateral resolution, but the combination of both is generally not possible. Methods With a TOF‐SIMS setup, a delayed extraction applied to secondary ions has been studied extensively on rat cerebellum sections in order to compensate for the effect of long primary ion bunches. Results The use of a delayed extraction has been proven to be an efficient solution leading to unique features, i.e. a mass resolution up to 10000 at m/z 385.4 combined with a lateral resolution of about 400 nm. Simulations of ion trajectories confirm the experimental determination of optimal delayed extraction and allow understanding of the behavior of ions as a function of their mass‐to‐charge ratio. Conclusions Although the use of a delayed extraction has been well known for many years and is very popular in MALDI, it is much less used in TOF‐SIMS. Its full characterization now enables secondary ion images to be recorded in a single run with a submicron spatial resolution and with a mass resolution of several thousand. This improvement is very useful when analyzing lipids on tissue sections, or rare, precious, or very small size samples. © 2015 The Authors. Rapid Communications in Mass Spectrometry published by John Wiley & Sons Ltd. PMID:26395603

Stochastic modelling in design of mechanical properties of nanometals

International Nuclear Information System (INIS)

Tengen, T.B.; Wejrzanowski, T.; Iwankiewicz, R.; Kurzydlowski, K.J.

2010-01-01

Polycrystalline nanometals are being fabricated through different processing routes and conditions. The consequence is that nanometals having the same mean grain size may have different grain size dispersion and, hence, may have different material properties. This has often led to conflicting reports from both theoretical and experimental findings about the evolutions of the mechanical properties of nanomaterials. The present paper employs stochastic model to study the impact of microstructure evolution during grain growth on the mechanical properties of polycrystalline nanometals. The stochastic model for grain growth and the stochastic model for changes in mechanical properties of nanomaterials are proposed. The model for the mechanical properties developed is tested on aluminium samples.Many salient features of the mechanical properties of the aluminium samples are revealed. The results show that the different mechanisms of grain growth impart different nature of response to the material mechanical properties. The conventional, homologous and anomalous temperature dependences of the yield stress have also been revealed to be due to different nature of interactions of the microstructures during evolution.

First Beam Test of Nanometer Spot Size Monitor Using Laser Interferometry

CERN Document Server

Walz, D

2003-01-01

The nanometer spot size monitor based on the laser interferometry (Laser-Compton Spot Size Monitor) has been tested in FFTB beam line at SLAC. A low emittance beam of 46 GeV electrons, provided by the two-mile linear accelerator, was focused into nanometer spot in the FFTB line, and its transverse dimensions were precisely measured by the spot size monitor.

First Beam Test of Nanometer Spot Size Monitor Using Laser Interferometry

International Nuclear Information System (INIS)

Walz, Dieter R

2003-01-01

The nanometer spot size monitor based on the laser interferometry (Laser-Compton Spot Size Monitor) has been tested in FFTB beam line at SLAC. A low emittance beam of 46 GeV electrons, provided by the two-mile linear accelerator, was focused into nanometer spot in the FFTB line, and its transverse dimensions were precisely measured by the spot size monitor

HEATHER - HElium Ion Accelerator for RadioTHERapy

Energy Technology Data Exchange (ETDEWEB)

Taylor, Jordan [Huddersfield U.; Edgecock, Thomas [Huddersfield U.; Green, Stuart [Birmingham U.; Johnstone, Carol [Fermilab

2017-05-01

A non-scaling fixed field alternating gradient (nsFFAG) accelerator is being designed for helium ion therapy. This facility will consist of 2 superconducting rings, treating with helium ions (He²⁺ ) and image with hydrogen ions (H + 2 ). Currently only carbon ions are used to treat cancer, yet there is an increasing interest in the use of lighter ions for therapy. Lighter ions have reduced dose tail beyond the tumour compared to carbon, caused by low Z secondary particles produced via inelastic nuclear reactions. An FFAG approach for helium therapy has never been previously considered. Having demonstrated isochronous acceleration from 0.5 MeV to 900 MeV, we now demonstrate the survival of a realistic beam across both stages.

Implementation of a secondary-ion tritium beam by means of the associated particle technique and its test on a gold target

Energy Technology Data Exchange (ETDEWEB)

Policroniades, R.; Fernández-Arnáiz, J.; Murillo, G.; Moreno, E.; Villaseñor, P.; Méndez, B. [Departamento de Aceleradores, Instituto Nacional de Investigaciones Nucleares, Carr. México-Toluca S/N, Ocoyoacac, Estado de México 52750 (Mexico); Chávez, E.; Ortíz-Salazar, M.E.; Huerta, A. [Instituto de Física, Universidad Nacional Autónoma de México, A.P. 20-364, México, D.F. 01000 (Mexico); Varela-González, A. [Centro de Ciencias de la Atmósfera, Universidad Nacional Autónoma de México, A.P. 20-364, México, D.F. 01000 (Mexico)

2014-05-21

In this work we present the implementation and characterization of a (secondary ion) tritium beam generated through the D(d,t)p reaction, at deuteron energies of 2.0 and 1.88 MeV, tagging the tritium ions with the associated particle technique. In order to prove its utility as a projectile for scientific applications, this beam was made to impinge on a thin gold target to observe expected elastic scattering events. - Highlights: • A new secondary ion tritium beam obtained through the D(d,t)3He reaction. • Tritium beam tagging by the associated particle technique. • A low energy Tritium beam without radiation contamination of equipment. • Tritium elastic scattering on gold.

Implementation of a secondary-ion tritium beam by means of the associated particle technique and its test on a gold target

International Nuclear Information System (INIS)

Policroniades, R.; Fernández-Arnáiz, J.; Murillo, G.; Moreno, E.; Villaseñor, P.; Méndez, B.; Chávez, E.; Ortíz-Salazar, M.E.; Huerta, A.; Varela-González, A.

2014-01-01

In this work we present the implementation and characterization of a (secondary ion) tritium beam generated through the D(d,t)p reaction, at deuteron energies of 2.0 and 1.88 MeV, tagging the tritium ions with the associated particle technique. In order to prove its utility as a projectile for scientific applications, this beam was made to impinge on a thin gold target to observe expected elastic scattering events. - Highlights: • A new secondary ion tritium beam obtained through the D(d,t)3He reaction. • Tritium beam tagging by the associated particle technique. • A low energy Tritium beam without radiation contamination of equipment. • Tritium elastic scattering on gold

Secondary electron emission from Au by medium energy atomic and molecular ions

CERN Document Server

Itoh, A; Obata, F; Hamamoto, Y; Yogo, A

2002-01-01

Number distributions of secondary electrons emitted from a Au metal surface have been measured for atomic and molecular ions of H sup + , He sup + , C sup + , N sup + , O sup + , H sup + sub 2 , H sup + sub 3 , HeH sup + , CO sup + and O sup + sub 2 in the energy range 0.3-2.0 MeV. The emission statistics obtained are described fairly well by a Polya function. The Polya parameter b, determining the distribution shape, is found to decrease monotonously with increasing emission yield gamma, revealing a surprising relationship of b gamma approx 1 over the different projectile species and impact energies. This finding supports certainly the electron cascading model. Also we find a strong negative molecular effect for heavier molecular ions, showing a significant reduction of gamma compared to the estimated values using constituent atomic projectile data.

MMS Observations of Ion-Scale Magnetic Island in the Magnetosheath Turbulent Plasma

Science.gov (United States)

Huang, S. Y.; Sahraoui, F.; Retino, A.; Contel, O. Le; Yuan, Z. G.; Chasapis, A.; Aunai, N.; Breuillard, H.; Deng, X. H.; Zhou, M.;

Introduction of Functional Structures in Nano-Scales into Engineering Polymer Films Using Radiation Technique

Energy Technology Data Exchange (ETDEWEB)

Maekawa, Y., E-mail: maekawa.yasunari@jaea.go.jp [Japan Atomic Energy Agency (JAEA), Quantum Beam Science Directorate, High Performance Polymer Group, 1233 Watanuki-Machi, Takasaki, Gunma-ken 370-1292 (Japan)

2010-07-01

Introduction of functional regions in nanometer scale in polymeric films using γ-rays, EB, and ion beams are proposed. Two approaches to build nano-scale functional domains in polymer substrates are proposed: 1) Radiation-induced grafting to transfer nano-scale polymer crystalline structures (morphology), acting as a nano-template, to nano-scale graft polymer regions. The obtained polymers with nano structures can be applied to high performance polymer membranes. 2) Fabrication of nanopores and functional domains in engineering plastic films using ion beams, which deposit the energy in very narrow region of polymer films. Hydrophilic grafting polymers are introduced into hydrophobic fluorinated polymers, cross-linked PTFE (cPTFE) and aromatic hydrocarbon polymer, poly(ether ether ketone (PEEK), which is known to have lamella and crystallite in the polymer films. Then, the hierarchical structures of graft domains are analyzed by a small angle neutron scattering (SANS) experiment. From these analyses, the different structures and the different formation of graft domains were observed in fluorinated and hydrocarbon polymer substrates. the grafted domains in the cPTFE film, working as an ion channel, grew as covering the crystallite and the size of domain seems to be similar to that of crystallite. On the other hand, the PEEK-based PEM has a smaller domain size and it seems to grow independently on the crystallites of PEEK substrate. For nano-fabrication of polymer films using heavy ion beams, the energy distribution in radial direction, which is perpendicular to ion trajectory, is mainly concerned. For penumbra, we re-estimated effective radius of penumbra, in which radiation induced grafting took place, for several different ion beams. We observed the different diameters of the ion channels consisting of graft polymers. The channel sizes were quite in good agreement with the effective penumbra which possess the absorption doses more than 1 kGy. (author)

Introduction of Functional Structures in Nano-Scales into Engineering Polymer Films Using Radiation Technique

International Nuclear Information System (INIS)

Maekawa, Y.

2010-01-01

Introduction of functional regions in nanometer scale in polymeric films using γ-rays, EB, and ion beams are proposed. Two approaches to build nano-scale functional domains in polymer substrates are proposed: 1) Radiation-induced grafting to transfer nano-scale polymer crystalline structures (morphology), acting as a nano-template, to nano-scale graft polymer regions. The obtained polymers with nano structures can be applied to high performance polymer membranes. 2) Fabrication of nanopores and functional domains in engineering plastic films using ion beams, which deposit the energy in very narrow region of polymer films. Hydrophilic grafting polymers are introduced into hydrophobic fluorinated polymers, cross-linked PTFE (cPTFE) and aromatic hydrocarbon polymer, poly(ether ether ketone (PEEK), which is known to have lamella and crystallite in the polymer films. Then, the hierarchical structures of graft domains are analyzed by a small angle neutron scattering (SANS) experiment. From these analyses, the different structures and the different formation of graft domains were observed in fluorinated and hydrocarbon polymer substrates. the grafted domains in the cPTFE film, working as an ion channel, grew as covering the crystallite and the size of domain seems to be similar to that of crystallite. On the other hand, the PEEK-based PEM has a smaller domain size and it seems to grow independently on the crystallites of PEEK substrate. For nano-fabrication of polymer films using heavy ion beams, the energy distribution in radial direction, which is perpendicular to ion trajectory, is mainly concerned. For penumbra, we re-estimated effective radius of penumbra, in which radiation induced grafting took place, for several different ion beams. We observed the different diameters of the ion channels consisting of graft polymers. The channel sizes were quite in good agreement with the effective penumbra which possess the absorption doses more than 1 kGy. (author)

Secondary ion emission from cleaned surfaces bombarded by 100 MeV accelerator beams at the GSI Darmstadt

International Nuclear Information System (INIS)

Wien, K.; Becker, O.; Guthier, W.; Knippelberg, W.; Koczon, P.

1988-01-01

The 1.4 MeV/n beam facility for the UNILAC/GSI has been used to study secondary ion emission from surfaces cleaned under UHV conditions by ion etching or cleaving of crystals. The desorption phenomena observed by means of TOF mass spectrometry can be classified as follows: (1) Clean metal surfaces emit metal ions being ejected by atomic collisions cascades. Electronic excitation of surface states seems to support ionization. (2) The desorption of contaminants adsorbed at the metal surface is strongly correlated with the electronic energy loss of the projectiles - even, if the content of impurities is very low. (3) Ion formation at the epitaxial surface of fluoride crystals as CaF 2 , MgF 2 and NaF is initiated by the electronic excitation of the crystal. At high beam energies the mass spectrum is dominated by a series of cluster ions. These cluster ions disappear below a certain energy deposit threshold, whereas small atomic ions are observed over the whole energy range

Determination of isotopic composition of uranium in microparticles by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Veniaminov, N.N.; Kolesnikov, O.N.; Stebel'kov, V.A.

1992-01-01

Aerosol particles including uranium in their composition are specific atmospheric polutants. Uranium is used as nuclear fuel in atomic power stations and in spacecraft power units, and also as a component of nuclear warheads. In order to monitor the discharge of uranium-containing aerosol particles to the atmosphere, they must first be identified. As an example, one may cite an investigation of the elemental composition and radioactivity of particles formed in the accident at the Chernobyl atomic power station. One of the most informative indicators of the origin of uranium-containing aerosol particles is the isotopic composition of the uranium. Secondary ion mass spectrometry (SIMS) offers unique possibilities for the measurement of isotope ratios in individual microscopic objects. At the same time, a measurement of isotope ratios of sulfur in microsection of galenite PbS 2 has shown that the application of SIMS for these purposes is seriously limited by the difference in yield of secondary ions for isotopes with different masses. These discrimination effects, in the case of light elements such as boron, may result in distortion of the isotope ratios by several percent. In the case of heavy elements, however, the effect is less significant, amounting to about 0.5% for lead isotopes. 13 refs., 3 figs., 1 tab

Secondary Analysis of Large-Scale Assessment Data: An Alternative to Variable-Centred Analysis

Science.gov (United States)

Chow, Kui Foon; Kennedy, Kerry John

2014-01-01

International large-scale assessments are now part of the educational landscape in many countries and often feed into major policy decisions. Yet, such assessments also provide data sets for secondary analysis that can address key issues of concern to educators and policymakers alike. Traditionally, such secondary analyses have been based on a…

Ranges, Reflection and Secondary Electron Emission for keV Hydrogen Ions Incident on Solid N2

DEFF Research Database (Denmark)

Børgesen, P.; Sørensen, H.; Hao-Ming, Chen

1983-01-01

Ranges were measured for 0.67–3.3 keV/amu hydrogen and deuterium ions in solid N2. Comparisons with similar results for N2-gas confirm the previously observed large phase effect in the stopping cross section. Measurements of the secondary electron emission coefficient for bulk solid N2 bombarded...... by 0.67–9 keV/amu ions also seem to support such a phase effect. It is argued that we may also extract information about the charge state of reflected projectiles....

Tracing Of Scaling Elements In Secondary Cooling System Of GA Siwabessy Reactor By Neutron Activation Analysis

International Nuclear Information System (INIS)

Lestari, Diyah Erlina

2000-01-01

Determination of content of chemical elements and scale formed in the secondary cooling water has been carried out by means of AAN method. The counting was performed using a gamma spectrometer equipped with high resolution HPGe gamma detector. Result of counting show the elements contained in the scale are: Na, Br, Fe, Ci, Mg and Co which are also found in the secondary cooling water. The main scaling element cannot yet be detected

Continuous scanning of the mobility and size distribution of charged clusters and nanometer particles in atmospheric air and the Balanced Scanning Mobility Analyzer BSMA

Science.gov (United States)

Tammet, H.

2006-12-01

Measuring of charged nanometer particles in atmospheric air is a routine task in research on atmospheric electricity, where these particles are called the atmospheric ions. An aspiration condenser is the most popular instrument for measuring atmospheric ions. Continuous scanning of a mobility distribution is possible when the aspiration condenser is connected as an arm of a balanced bridge. Transfer function of an aspiration condenser is calculated according to the measurements of geometric dimensions, air flow rate, driving voltage, and electric current. The most complicated phase of the calibration is the estimation of the inlet loss of ions due to the Brownian deposition. The available models of ion deposition on the protective inlet screen and the inlet control electrofilter have the uncertainty of about 20%. To keep the uncertainty of measurements low the adsorption should not exceed a few tens of percent. The online conversion of the mobility distribution to the size distribution and a correct reduction of inlet losses are possible when air temperature and pressure are measured simultaneously with the mobility distribution. Two instruments called the Balanced Scanning Mobility Analyzers (BSMA) were manufactured and tested in routine atmospheric measurements. The concentration of atmospheric ions of the size of about a few nanometers is very low and a high air flow rate is required to collect enough of ion current. The air flow of 52 l/s exceeds the air flow in usual aerosol instruments by 2-3 orders of magnitude. The high flow rate reduces the time of ion passage to 60 ms and the heating of air in an analyzer to 0.2 K, which suppresses a possible transformation of ions inside the instrument. The mobility range of the BSMA of 0.032-3.2 cm 2 V - 1 s - 1 is logarithmically uniformly divided into 16 fractions. The size distribution is presented by 12 fractions in the diameter range of 0.4-7.5 nm. The measurement noise of a fraction concentration is typically

Nanometer-Scale Chemistry of a Calcite Biomineralization Template: Implications for Skeletal Composition and Nucleation

Energy Technology Data Exchange (ETDEWEB)

Branson, Oscar; Bonnin, Elisa A.; Perea, Daniel E.; Spero, Howard J.; Zhu, Zihua; Winters, Maria; Hönisch, Bärbel; Russell, Ann D.; Fehrenbacher, Jennifer S.; Gagnon, Alexander C.

2016-10-28

Biomineralizing organisms exhibit exquisite control over skeletal morphology and composition. The promise of understanding and harnessing this feat of natural engineering has motivated an intense search for the mechanisms that direct in vivo mineral self-assembly. We used atom probe tomography, a sub-nanometer 3D chemical mapping technique, to examine the chemistry of a buried organic-mineral interface in biomineral calcite from a marine foraminifer. The chemical patterns at this interface capture the processes of early biomineralization, when the shape, mineralogy, and orientation of skeletal growth are initially established. Sodium is enriched by a factor of nine on the organic side of the interface. Based on this pattern, we suggest that sodium plays an integral role in early biomineralization, potentially altering interfacial energy to promote crystal nucleation, and that interactions between organic surfaces and electrolytes other than calcium or carbonate could be a crucial aspect of CaCO3 biomineralization.

Nano-scale processes behind ion-beam cancer therapy

Science.gov (United States)

Surdutovich, Eugene; Garcia, Gustavo; Mason, Nigel; Solov'yov, Andrey V.

2016-04-01

This topical issue collates a series of papers based on new data reported at the third Nano-IBCT Conference of the COST Action MP1002: Nanoscale Insights into Ion Beam Cancer Therapy, held in Boppard, Germany, from October 27th to October 31st, 2014. The Nano-IBCT COST Action was launched in December 2010 and brought together more than 300 experts from different disciplines (physics, chemistry, biology) with specialists in radiation damage of biological matter from hadron-therapy centres, and medical institutions. This meeting followed the first and the second conferences of the Action held in October 2011 in Caen, France and in May 2013 in Sopot, Poland respectively. This conference series provided a focus for the European research community and has highlighted the pioneering research into the fundamental processes underpinning ion beam cancer therapy. Contribution to the Topical Issue "COST Action Nano-IBCT: Nano-scale Processes Behind Ion-Beam Cancer Therapy", edited by Andrey V. Solov'yov, Nigel Mason, Gustavo Garcia and Eugene Surdutovich.

Spatial structure of ion-scale plasma turbulence

Directory of Open Access Journals (Sweden)

Yasuhito eNarita

2014-03-01

Full Text Available Spatial structure of small-scale plasma turbulence is studied under different conditions of plasma parameter beta directly in the three-dimensional wave vector domain. Two independent approaches are taken: observations of turbulent magnetic field fluctuations in the solar wind measured by four Cluster spacecraft, and direct numerical simulations of plasma turbulence using the hybrid code AIKEF, both resolving turbulence on the ion kinetic scales. The two methods provide independently evidence of wave vector anisotropy as a function of beta. Wave vector anisotropy is characterized primarily by an extension of the energy spectrum in the direction perpendicular to the large-scale magnetic field. The spectrum is strongly anisotropic at lower values of beta, and is more isotropic at higher values of beta. Cluster magnetic field data analysis also provides evidence of axial asymmetry of the spectrum in the directions around the large-scale field. Anisotropy is interpreted as filament formation as plasma evolves into turbulence. Axial asymmetry is interpreted as the effect of radial expansion of the solar wind from the corona.

Identity confirmation of drugs and explosives in ion mobility spectrometry using a secondary drift gas.

Science.gov (United States)

Kanu, Abu B; Hill, Herbert H

2007-10-15

This work demonstrated the potential of using a secondary drift gas of differing polarizability from the primary drift gas for confirmation of a positive response for drugs or explosives by ion mobility spectrometry (IMS). The gas phase mobilities of response ions for selected drugs and explosives were measured in four drift gases. The drift gases chosen for this study were air, nitrogen, carbon dioxide and nitrous oxide providing a range of polarizability and molecular weights. Four other drift gases (helium, neon, argon and sulfur hexafluoride) were also investigated but design limitations of the commercial instrument prevented their use for this application. When ion mobility was plotted against drift gas polarizability, the resulting slopes were often unique for individual ions, indicating that selectivity factors between any two analytes varied with the choice of drift gas. In some cases, drugs like THC and heroin, which are unresolved in air or nitrogen, were well resolved in carbon dioxide or nitrous oxide.

Preparation, characterization and optical properties of Lanthanum-(nanometer MCM-41) composite materials

International Nuclear Information System (INIS)

Zhai, Q. Z.; Wang, P.

2008-01-01

Nanometer MCM-41 molecular sieve was prepared under a base condition by using cetyltrimethylammonium bromide as template and tetraethyl orthosilicate as silica source by means of hydrothermal method. Lanthanum(III) was incorporated into the nanometer MCM-41 by a liquid phase grafting method. The prepared nano composite materials were characterized by means of powder X-ray diffraction, spectrophotometric analysis, Fourier transform infrared spectroscopy, low temperature nitrogen adsorption-desorption technique, solid diffuse reflectance absorption spectra and luminescence. The powder X-ray diffraction studies show that the nanometer MCM-41 molecular sieve is successfully prepared. The highly ordered meso porous two-dimensional hexagonal channel structure and framework of the support MCM-41 is retained intact in the prepared composite material La-(nanometer MCM-41). The spectrophotometric analysis indicates that lanthanum exists in the prepared nano composite materials. The Fourier transform infrared spectra indicate that the framework of the MCM-41 molecular sieve still remains in the prepared nano composite materials and some framework vibration peaks show blue shifts relative to those of the MCM-41 molecular sieve. The low temperature nitrogen adsorption-desorption indicates that the guest locales in the channel of the molecular sieve. Compared with bulk lanthanum oxide, the guest in the channel of the molecular sieve has smaller particle size and shows a significant blue shift of optical absorption band in solid diffuse reflectance absorption spectra. The observed blue shift in the solid state diffuse reflectance absorption spectra of the lanthanum-(nanometer MCM-41) sample show the obvious stereoscopic confinement effect of the channel of the host on the guest, which further indicates the successful encapsulation of the guest in the host. The La-(nanometer MCM-41) sample shows luminescence

Enhanced Laser Cooling of Rare-Earth-Ion-Doped Glass Containing Nanometer-Sized Metallic Particles

International Nuclear Information System (INIS)

Jia Youhua; Zhong Biao; Yin Jianping

2009-01-01

The enhanced laser cooling performance of rare-earth-ions-doped glasses containing small particles is predicted. This is achieved by the enhancement of local field around rare earth ions, owing to the surface plasmon resonance of small metallic particles. The role of energy transfer between ions and the particle is theoretical discussed. Depending on the particle size and the ion emission quantum efficiency, the enhancement of the absorption and the fluorescence is predicted. Moreover, taking Yb 3+ -doped ZBLAN as example, the cooling power and heat-light converting efficiency are calculated. It is finally concluded that the absorption and the fluorescence are greatly enhanced in these composite materials, the cooling power is increased compared to the bulk material. (condensed matter: electronic structure, electrical, magnetic, and optical properties)

High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

International Nuclear Information System (INIS)

Wirtz, T; Philipp, P; Audinot, J-N; Dowsett, D; Eswara, S

2015-01-01

Secondary ion mass spectrometry (SIMS) constitutes an extremely sensitive technique for imaging surfaces in 2D and 3D. Apart from its excellent sensitivity and high lateral resolution (50 nm on state-of-the-art SIMS instruments), advantages of SIMS include high dynamic range and the ability to differentiate between isotopes. This paper first reviews the underlying principles of SIMS as well as the performance and applications of 2D and 3D SIMS elemental imaging. The prospects for further improving the capabilities of SIMS imaging are discussed. The lateral resolution in SIMS imaging when using the microprobe mode is limited by (i) the ion probe size, which is dependent on the brightness of the primary ion source, the quality of the optics of the primary ion column and the electric fields in the near sample region used to extract secondary ions; (ii) the sensitivity of the analysis as a reasonable secondary ion signal, which must be detected from very tiny voxel sizes and thus from a very limited number of sputtered atoms; and (iii) the physical dimensions of the collision cascade determining the origin of the sputtered ions with respect to the impact site of the incident primary ion probe. One interesting prospect is the use of SIMS-based correlative microscopy. In this approach SIMS is combined with various high-resolution microscopy techniques, so that elemental/chemical information at the highest sensitivity can be obtained with SIMS, while excellent spatial resolution is provided by overlaying the SIMS images with high-resolution images obtained by these microscopy techniques. Examples of this approach are given by presenting in situ combinations of SIMS with transmission electron microscopy (TEM), helium ion microscopy (HIM) and scanning probe microscopy (SPM). (paper)

Surface nanostructuring of TiO2 thin films by ion beam irradiation

International Nuclear Information System (INIS)

Romero-Gomez, P.; Palmero, A.; Yubero, F.; Vinnichenko, M.; Kolitsch, A.; Gonzalez-Elipe, A.R.

2009-01-01

This work reports a procedure to modify the surface nanostructure of TiO 2 anatase thin films through ion beam irradiation with energies in the keV range. Irradiation with N + ions leads to the formation of a layer with voids at a depth similar to the ion-projected range. By setting the ion-projected range a few tens of nanometers below the surface of the film, well-ordered nanorods appear aligned with the angle of incidence of the ion beam. Slightly different results were obtained by using heavier (S + ) and lighter (B + ) ions under similar conditions

Ion beam profiling from the interaction with a freestanding 2D layer

Directory of Open Access Journals (Sweden)

Ivan Shorubalko

2017-03-01

Full Text Available Recent years have seen a great potential of the focused ion beam (FIB technology for the nanometer-scale patterning of a freestanding two-dimensional (2D layer. Experimentally determined sputtering yields of the perforation process can be quantitatively explained using the binary collision theory. The main peculiarity of the interaction between the ion beams and the suspended 2D material lies in the absence of collision cascades, featured by no interaction volume. Thus, the patterning resolution is directly set by the beam diameters. Here, we demonstrate pattern resolution beyond the beam size and precise profiling of the focused ion beams. We find out that FIB exposure time of individual pixels can influence the resultant pore diameter. In return, the pore dimension as a function of the exposure dose brings out the ion beam profiles. Using this method of determining an ion-beam point spread function, we verify a Gaussian profile of focused gallium ion beams. Graphene sputtering yield is extracted from the normalization of the measured Gaussian profiles, given a total beam current. Interestingly, profiling of unbeknown helium ion beams in this way results in asymmetry of the profile. Even triangular beam shapes are observed at certain helium FIB conditions, possibly attributable to the trimer nature of the beam source. Our method of profiling ion beams with 2D-layer perforation provides more information on ion beam profiles than the conventional sharp-edge scan method does.

Preparation and Characterization of Some Nanometal Oxides Using Microwave Technique and Their Application to Cotton Fabrics

Directory of Open Access Journals (Sweden)

M. Gouda

2015-01-01

Full Text Available The objective of this paper is the synthesis of some nanometal oxides via microwave irradiation technique and their application to augment multifunctional properties of cotton fabric. Cotton fabrics containing nanometal oxides were prepared via a thiol-modification of cotton fabric samples and then dipped into the metal salt solutions precursors and transferred to the microwave oven. The surface morphology and quantitative analysis of the obtained modified cotton fabrics containing nanometal oxides were studied by scanning electron microscopy coupled with high energy dispersive X-ray (SEM-EDX. The shape and distribution of nanometal oxide inside the fabric samples were analyzed by transmission electron microscopy of cross-section fabric samples. The iron oxide nanoparticles had a nanosphere with particle size diameter 15–20 nm, copper oxide nanoparticles had a nanosphere with particle size diameter 25–30 nm, and cobalt oxide nanoparticles had a nanotube-like shape with a length of 100–150 nanometer and a diameter of ~58 nanometer, whereas the manganese oxide nanoparticles had a linear structure forming nanorods with a diameter of 50–55 nanometer and a length of 70–80 nanometers. Antibacterial activity was evaluated quantitatively against gram-positive bacteria such as Staphylococcus aureus and gram-negative bacteria such as Escherichia coli, UV-protection activity was analyzed using UV-DRS spectroscopy, and flame retardation of prepared fabric samples was evaluated according to the limiting oxygen index (LOI. Results revealed that the prepared fabric sample containing nanometal oxide possesses improved antibacterial, LOI, and UV-absorbing efficiency. Moreover, the metal oxide nanoparticles did not leach out the fabrics by washing even after 30 laundering washing cycles.

Prize for Industrial Applications of Physics Talk: Low energy spread Ion source for focused ion beam systems-Search for the holy grail

Science.gov (United States)

Ward, Bill

2011-03-01

In this talk I will cover my personal experiences as a serial entrepreneur and founder of a succession of focused ion beam companies (1). Ion Beam Technology, which developed a 200kv (FIB) direct ion implanter (2). Micrion, where the FIB found a market in circuit edit and mask repair, which eventually merged with FEI corporation. and (3). ALIS Corporation which develop the Orion system, the first commercially successful sub-nanometer helium ion microscope, that was ultimately acquired by Carl Zeiss corporation. I will share this adventure beginning with my experiences in the early days of ion beam implantation and e-beam lithography which lead up to the final breakthrough understanding of the mechanisms that govern the successful creation and operation of a single atom ion source.

Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool

International Nuclear Information System (INIS)

Smentkowski, Vincent S.; Ostrowski, Sara G.

2007-01-01

Combinatorial materials libraries are becoming more complicated; successful screening of these libraries requires the development of new high throughput screening methodologies. Time of flight secondary ion mass spectrometry (ToF-SIMS) is a surface analytical technique that is able to detect and image all elements (including hydrogen which is problematic for many other analysis instruments) and molecular fragments, with high mass resolution, during a single measurement. Commercial ToF-SIMS instruments can image 500 μm areas by rastering the primary ion beam over the region of interest. In this work, we will show that large area analysis can be performed, in one single measurement, by rastering the sample under the ion beam. We show that an entire 70 mm diameter wafer can be imaged in less than 90 min using ToF-SIMS stage (macro)rastering techniques. ToF-SIMS data sets contain a wealth of information since an entire high mass resolution mass spectrum is saved at each pixel in an ion image. Multivariate statistical analysis (MVSA) tools are being used in the ToF-SIMS community to assist with data interpretation; we will demonstrate that MVSA tools provide details that were not obtained using manual (univariate) analysis

Individual analysis of nonmetallic Inclusions in Steel by using the gallium focused ion beam secondary ion mass spectrometry

International Nuclear Information System (INIS)

Tomiyasu, Bunbunoshin; Inami, Akihiro; Abe, Masakazu; Nihei, Yoshimasa.

1995-01-01

Nonmetallic inclusions frequently exert a lot of unfavorable influences on the quality of steel. The size of nonmetallic inclusions in current steel products is less than a few μm in diameter. It is desirable to make clear the origin and generation process of such small particles of nonmetallic inclusion. In order to measure the shape, size, composition and inner elemental distribution, development of characterization methods for each inclusion particle is required. By employing a gallium focused ion beam (FIB) as a primary ion beam of secondary ion mass spectrometry (SIMS), the particle analysis with high spatial resolution is easily achieved. In this paper, we present the novel individual analysis of nonmetallic inclusions in steel by gallium FIB SIMS. We analyzed in two ways the nonmetallic inclusion particles segregated by electron beam melting. (1) By cross-sectioning of the particle using a gallium FIB, elemental maps of cross-section were obtained. The elements were distributed inhomogeneously on the cross-section. (2) We carried out the compositional analysis for several particles individually. Ten particles were analyzed by the shave-off analysis and the multivariate cluster analysis. Based on the composition of each particle, the inclusions were classified into six types. (author)

Diffusion of iron in lithium niobate: a secondary ion mass spectrometry study

Energy Technology Data Exchange (ETDEWEB)

Ciampolillo, M.V.; Argiolas, N.; Zaltron, A.; Bazzan, M.; Sada, C. [University of Padova, Physics Department (Italy); CNISM, Padova (Italy)

2011-10-15

Iron-doped X-cut lithium niobate crystals were prepared by means of thermal diffusion from thin film varying in a systematic way the process parameters such as temperature and diffusion duration. Secondary Ion Mass Spectrometry was exploited to characterize the iron in-depth profiles. The evolution of the composition of the Fe thin film in the range between 600 C and 800 C was studied, and the diffusion coefficient at different temperatures in the range between 900 C and 1050 C and the activation energy of the diffusion process were estimated. (orig.)

MMS Observations of the Evolution of Ion-Scale Flux Transfer Events

Science.gov (United States)

Zhao, C.; Russell, C. T.; Strangeway, R. J.; Paterson, W.; Petrinec, S.; Zhou, M.; Anderson, B. J.; Baumjohann, W.; Bromund, K. R.; Chutter, M.; Fischer, D.; Gershman, D. J.; Giles, B. L.; Le, G.; Nakamura, R.; Plaschke, F.; Slavin, J. A.; Torbert, R. B.

2017-12-01

Flux transfer events are key processes in the solar wind-magnetosphere interaction. Previously, the observed flux transfer events have had scale sizes of 10,000 km radius in the cross-section and connect about 2 MWb magnetic flux from solar wind to the terrestrial magnetosphere. Recently, from the high-temporal resolution MMS magnetic field data, many ion-scale FTEs have been found. These FTEs contains only about 2 kWb magnetic flux and are believed to be in an early stage of FTE evolution. With the help of the well-calibrated MMS data, we are also able to determine the velocity profile and forces within the FTE events. We find that some ion-scale FTEs are expanding as we expect, but there are also contracting FTEs. We examine the differences between the two classes of FTEs and their differences with the larger previously studied class of FTE.

SQUID magnetometry from nanometer to centimeter length scales

International Nuclear Information System (INIS)

Hatridge, Michael J.

2010-01-01

The development of Superconducting QUantum Interference Device (SQUID)-based magnetometer for two applications, in vivo prepolarized, ultra-low field MRI of humans and dispersive readout of SQUIDs for micro- and nano-scale magnetometery, are the focus of this thesis.

SQUID magnetometry from nanometer to centimeter length scales

Energy Technology Data Exchange (ETDEWEB)

Hatridge, Michael J. [Univ. of California, Berkeley, CA (United States)

2010-06-01

The development of Superconducting QUantum Interference Device (SQUID)-based magnetometer for two applications, in vivo prepolarized, ultra-low field MRI of humans and dispersive readout of SQUIDs for micro- and nano-scale magnetometery, are the focus of this thesis.

Nuclear Forensics: Measurements of Uranium Oxides Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Science.gov (United States)

2010-03-01

Isotope Ratio Analysis of Actinides , Fission Products, and Geolocators by High- efficiency Multi-collector Thermal Ionization Mass Spectrometry...Information, 1999. Hou, Xiaolin, and Per Roos. “ Critical Comparison of radiometric and Mass Spectrometric Methods for the Determination of...NUCLEAR FORENSICS: MEASUREMENTS OF URANIUM OXIDES USING TIME-OF-FLIGHT SECONDARY ION MASS

Secondary emission ion analyzer provided with an electron gun for insulating material analysis

International Nuclear Information System (INIS)

Blanchard, Bruno; Carrier, Patrick; Marguerite, J.-L.; Rocco, J.-C.

1976-01-01

This invention relates to a secondary emission ion analyser, fitted with an electron gun. It is used in the mass spectrometry analysis of electrically insulating bodies. It has already been suggested to bombard the target with an electron beam in conjunction with the beam of primary particles, in order to reduce the space charge near the target. The object of this invention is the application of this known process to appliances of the ion analyser type with a high electric field near the target. Its main characteristic is the use of an electron gun emitting an electron beam through the extraction lens placed opposite the target. The extraction electric field influences the path of the electrons but the electric and mechanical specifications of the electron gun in the invention are such that the target is correctly sprayed by the electron beam [fr

Modeling of negative ion extraction from a magnetized plasma source: Derivation of scaling laws and description of the origins of aberrations in the ion beam

Science.gov (United States)

Fubiani, G.; Garrigues, L.; Boeuf, J. P.

2018-02-01

We model the extraction of negative ions from a high brightness high power magnetized negative ion source. The model is a Particle-In-Cell (PIC) algorithm with Monte-Carlo Collisions. The negative ions are generated only on the plasma grid surface (which separates the plasma from the electrostatic accelerator downstream). The scope of this work is to derive scaling laws for the negative ion beam properties versus the extraction voltage (potential of the first grid of the accelerator) and plasma density and investigate the origins of aberrations on the ion beam. We show that a given value of the negative ion beam perveance correlates rather well with the beam profile on the extraction grid independent of the simulated plasma density. Furthermore, the extracted beam current may be scaled to any value of the plasma density. The scaling factor must be derived numerically but the overall gain of computational cost compared to performing a PIC simulation at the real plasma density is significant. Aberrations appear for a meniscus curvature radius of the order of the radius of the grid aperture. These aberrations cannot be cancelled out by switching to a chamfered grid aperture (as in the case of positive ions).

Interaction of ion clusters with fusion plasmas: Scaling laws

International Nuclear Information System (INIS)

Arista, N.R.; Bringa, E.M.

1997-01-01

The interaction between large ion clusters or very intense ion beams with fusion plasma is studied using the dielectric function formalism with appropriate quantum corrections. The contributions from individual and collective modes to the energy loss are calculated. The general properties of the interference effects are characterized in terms of the relevant parameters, and simple scaling laws are obtained. In particular, the conditions for a maximum enhancement in the energy deposition are derived. The study provides a unified view and a general formulation of collective effects in the energy loss for low and high velocities of the beam particles. copyright 1997 The American Physical Society

Scaling of ion implanted Si:P single electron devices

International Nuclear Information System (INIS)

Escott, C C; Hudson, F E; Chan, V C; Petersson, K D; Clark, R G; Dzurak, A S

2007-01-01

We present a modelling study on the scaling prospects for phosphorus in silicon (Si:P) single electron devices using readily available commercial and free-to-use software. The devices comprise phosphorus ion implanted, metallically doped (n + ) dots (size range 50-500 nm) with source and drain reservoirs. Modelling results are compared to measurements on fabricated devices and discussed in the context of scaling down to few-electron structures. Given current fabrication constraints, we find that devices with 70-75 donors per dot should be realizable. We comment on methods for further reducing this number

Scaling of ion implanted Si:P single electron devices

Energy Technology Data Exchange (ETDEWEB)

Escott, C C [Centre for Quantum Computer Technology, School of Electrical Engineering and Telecommunications, UNSW, Sydney, NSW 2052 (Australia); Hudson, F E [Centre for Quantum Computer Technology, School of Electrical Engineering and Telecommunications, UNSW, Sydney, NSW 2052 (Australia); Chan, V C [Centre for Quantum Computer Technology, School of Electrical Engineering and Telecommunications, UNSW, Sydney, NSW 2052 (Australia); Petersson, K D [Centre for Quantum Computer Technology, School of Electrical Engineering and Telecommunications, UNSW, Sydney, NSW 2052 (Australia); Clark, R G [Centre for Quantum Computer Technology, School of Physics, UNSW, Sydney, 2052 (Australia); Dzurak, A S [Centre for Quantum Computer Technology, School of Electrical Engineering and Telecommunications, UNSW, Sydney, NSW 2052 (Australia)

2007-06-13

We present a modelling study on the scaling prospects for phosphorus in silicon (Si:P) single electron devices using readily available commercial and free-to-use software. The devices comprise phosphorus ion implanted, metallically doped (n{sup +}) dots (size range 50-500 nm) with source and drain reservoirs. Modelling results are compared to measurements on fabricated devices and discussed in the context of scaling down to few-electron structures. Given current fabrication constraints, we find that devices with 70-75 donors per dot should be realizable. We comment on methods for further reducing this number.

Effect of the track potential on the motion and energy flow of secondary electrons created from heavy-ion irradiation

Science.gov (United States)

Moribayashi, Kengo

2018-05-01

Using simulations, we have evaluated the effect of the track potential on the motion and energy flow of secondary electrons, with the goal of determining the spatial distribution of energy deposition due to irradiation with heavy ions. We have simulated this effect as a function of the mean path τ between the incident ion-impact-ionization events at ion energies Eion. Here, the track potential is the potential formed from electric field near this incident ion path. The simulations indicate that this effect is mainly determined by τ and hardly depends on Eion. To understand heavy ion beam science more deeply and to reduce the time required by simulations, we have proposed simple approximation methods that almost reproduce the simulation results here.

Wafer-Scale Hierarchical Nanopillar Arrays Based on Au Masks and Reactive Ion Etching for Effective 3D SERS Substrate

Directory of Open Access Journals (Sweden)

Dandan Men

2018-02-01

Full Text Available Two-dimensional (2D periodic micro/nanostructured arrays as SERS substrates have attracted intense attention due to their excellent uniformity and good stability. In this work, periodic hierarchical SiO2 nanopillar arrays decorated with Ag nanoparticles (NPs with clean surface were prepared on a wafer-scale using monolayer Au NP arrays as masks, followed by reactive ion etching (RIE, depositing Ag layer and annealing. For the prepared SiO2 nanopillar arrays decorated with Ag NPs, the size of Ag NPs was tuned from ca. 24 to 126 nanometers by controlling the deposition thickness of Ag film. Importantly, the SiO2 nanopillar arrays decorated with Ag NPs could be used as highly sensitive SERS substrate for the detection of 4-aminothiophenol (4-ATP and rhodamine 6G (R6G due to the high loading of Ag NPs and a very uniform morphology. With a deposition thickness of Ag layer of 30 nm, the SiO2 nanopillar arrays decorated with Ag NPs exhibited the best sensitive SERS activity. The excellent SERS performance of this substrate is mainly attributed to high-density “hotspots” derived from nanogaps between Ag NPs. Furthermore, this strategy might be extended to synthesize other nanostructured arrays with a large area, which are difficult to be prepared only via conventional wet-chemical or physical methods.

Wafer-Scale Hierarchical Nanopillar Arrays Based on Au Masks and Reactive Ion Etching for Effective 3D SERS Substrate.

Science.gov (United States)

Men, Dandan; Wu, Yingyi; Wang, Chu; Xiang, Junhuai; Yang, Ganlan; Wan, Changjun; Zhang, Honghua

2018-02-04

Two-dimensional (2D) periodic micro/nanostructured arrays as SERS substrates have attracted intense attention due to their excellent uniformity and good stability. In this work, periodic hierarchical SiO₂ nanopillar arrays decorated with Ag nanoparticles (NPs) with clean surface were prepared on a wafer-scale using monolayer Au NP arrays as masks, followed by reactive ion etching (RIE), depositing Ag layer and annealing. For the prepared SiO₂ nanopillar arrays decorated with Ag NPs, the size of Ag NPs was tuned from ca. 24 to 126 nanometers by controlling the deposition thickness of Ag film. Importantly, the SiO₂ nanopillar arrays decorated with Ag NPs could be used as highly sensitive SERS substrate for the detection of 4-aminothiophenol (4-ATP) and rhodamine 6G (R6G) due to the high loading of Ag NPs and a very uniform morphology. With a deposition thickness of Ag layer of 30 nm, the SiO₂ nanopillar arrays decorated with Ag NPs exhibited the best sensitive SERS activity. The excellent SERS performance of this substrate is mainly attributed to high-density "hotspots" derived from nanogaps between Ag NPs. Furthermore, this strategy might be extended to synthesize other nanostructured arrays with a large area, which are difficult to be prepared only via conventional wet-chemical or physical methods.

Nanometer Linear Focusing of Hard X Rays by a Multilayer Laue Lens

International Nuclear Information System (INIS)

Kang, H.C.; Stephenson, G.B.; Maser, J.; Liu, C.; Conley, R.; Macrander, A.T.; Vogt, S.

2006-01-01

We report on a type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multilayer and illuminating it in Laue diffraction geometry. Because of its large optical depth, a MLL spans the diffraction regimes applicable to a thin Fresnel zone plate and a crystal. Coupled wave theory calculations indicate that focusing to 5 nm or smaller with high efficiency should be possible. Partial MLL structures with outermost zone widths as small as 10 nm have been fabricated and tested with 19.5 keV synchrotron radiation. Focal sizes as small as 30 nm with efficiencies up to 44% are measured

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

OpenAIRE

G. Fubiani; H. P. L. de Esch; A. Simonin; R. S. Hemsworth

2008-01-01

The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER) is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses). The resulting seco...

Accounting for nanometer-thick adventitious carbon contamination in X-ray absorption spectra of carbon-based materials.

Science.gov (United States)

Mangolini, Filippo; McClimon, J Brandon; Rose, Franck; Carpick, Robert W

2014-12-16

Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy is a powerful technique for characterizing the composition and bonding state of nanoscale materials and the top few nanometers of bulk and thin film specimens. When coupled with imaging methods like photoemission electron microscopy, it enables chemical imaging of materials with nanometer-scale lateral spatial resolution. However, analysis of NEXAFS spectra is often performed under the assumption of structural and compositional homogeneity within the nanometer-scale depth probed by this technique. This assumption can introduce large errors when analyzing the vast majority of solid surfaces due to the presence of complex surface and near-surface structures such as oxides and contamination layers. An analytical methodology is presented for removing the contribution of these nanoscale overlayers from NEXAFS spectra of two-layered systems to provide a corrected photoabsorption spectrum of the substrate. This method relies on the subtraction of the NEXAFS spectrum of the overlayer adsorbed on a reference surface from the spectrum of the two-layer system under investigation, where the thickness of the overlayer is independently determined by X-ray photoelectron spectroscopy (XPS). This approach is applied to NEXAFS data acquired for one of the most challenging cases: air-exposed hard carbon-based materials with adventitious carbon contamination from ambient exposure. The contribution of the adventitious carbon was removed from the as-acquired spectra of ultrananocrystalline diamond (UNCD) and hydrogenated amorphous carbon (a-C:H) to determine the intrinsic photoabsorption NEXAFS spectra of these materials. The method alters the calculated fraction of sp(2)-hybridized carbon from 5 to 20% and reveals that the adventitious contamination can be described as a layer containing carbon and oxygen ([O]/[C] = 0.11 ± 0.02) with a thickness of 0.6 ± 0.2 nm and a fraction of sp(2)-bonded carbon of 0.19 ± 0.03. This

Nanometer sized structures grown by pulsed laser deposition

KAUST Repository

ElZein, Basma

2015-10-01

Nanometer sized materials can be produced by exposing a target to a laser source to remove material from the target and deposit the removed material onto a surface of a substrate to grow a thin film in a vacuum chamber

Sub-Nanometer Channels Embedded in Two-Dimensional Materials

KAUST Repository

Han, Yimo

2017-07-31

Two-dimensional (2D) materials are among the most promising candidates for next-generation electronics due to their atomic thinness, allowing for flexible transparent electronics and ultimate length scaling1. Thus far, atomically-thin p-n junctions2-7, metal-semiconductor contacts8-10, and metal-insulator barriers11-13 have been demonstrated. While 2D materials achieve the thinnest possible devices, precise nanoscale control over the lateral dimensions are also necessary. Although external one-dimensional (1D) carbon nanotubes14 can be used to locally gate 2D materials, this adds a non-trivial third dimension, complicating device integration and flexibility. Here, we report the direct synthesis of sub-nanometer 1D MoS2 channels embedded within WSe2 monolayers, using a dislocation-catalyzed approach. The 1D channels have edges free of misfit dislocations and dangling bonds, forming a coherent interface with the embedding 2D matrix. Periodic dislocation arrays produce 2D superlattices of coherent MoS2 1D channels in WSe2. Molecular dynamics (MD) simulations have identified other combinations of 2D materials that could form 1D channels. Density function theory (DFT) calculation predicts these 1D channels display type II band alignment needed for carrier confinement and charge separation to access the ultimate length scales necessary for future electronic applications.

[Electronic and structural properties of individual nanometer-size supported metallic clusters]. Final performance report

Energy Technology Data Exchange (ETDEWEB)

Reifenberger, R.

1993-09-01

This report summarizes the work performed under contract DOE-FCO2-84ER45162. During the past ten years, our study of electron emission from laser-illuminated field emission tips has taken on a broader scope by addressing problems of direct interest to those concerned with the unique physical and chemical properties of nanometer-size clusters. The work performed has demonstrated that much needed data can be obtained on individual nanometer-size clusters supported on a wide-variety of different substrates. The work was performed in collaboration with R.P. Andres in the School of Chemical Engineering at Purdue University. The Multiple Expansion Cluster Source developed by Andres and his students was essential for producing the nanometer-size clusters studied. The following report features a discussion of these results. This report provides a motivation for studying the properties of nanometer-size clusters and summarizes the results obtained.

Nanocavity formation processes in MgO(100) by light ion (D, He, Li) and heavy ion (Kr, Cu, Au) implantation

OpenAIRE

Veen, A. van; Fedorov, A.V.; Schut, H.; Labohm, F.; Kooi, B.J.; Hosson, J.Th.M. De

2002-01-01

In studies on the controlled growth of metallic precipitates in MgO it is attempted to use nanometer size cavities as precursors for formation of metallic precipitates. In MgO nanocavities can easily be generated by light gas ion bombardment at room temperature with typically 30 keV ion energy to a dose of 10^16 cm–2, followed by annealing to 1300 K. It has been shown earlier by transmission electron microscopy (TEM) that the cavities (thickness 2–3 nm and length/width 5–10 nm) have a perfect...

Static secondary ion mass spectrometry for organic and inorganic molecular analysis in solids

International Nuclear Information System (INIS)

Ham, Rita van; Vaeck, Luc van; Adriaens, Annemie; Adams, Freddy

2003-01-01

The use of mass spectra in secondary ion mass spectrometry (S-SIMS) to characterise the molecular composition of inorganic and organic analytes at the surface of solid samples is investigated. Methodological aspects such as mass resolution, mass accuracy, precision and accuracy of isotope abundance measurements, influence of electron flooding and sample morphology are addressed to assess the possibilities and limitations that the methodology can offer to support the structural assignment of the detected ions. The in-sample and between-sample reproducibility of relative peak intensities under optimised conditions is within 10%, but experimental conditions and local hydration, oxidation or contamination can drastically affect the mass spectra. As a result, the use of fingerprinting for identification becomes compromised. Therefore, the preferred way of interpretation becomes the deductive structural approach, based on the use of the empirical desorption-ionisation model. This approach is shown to allow the molecular composition of inorganic and organic components at the surface of solids to be characterised. Examples of inorganic speciation and identification of organic additives with unknown composition in inorganic salt mixtures are given. The methodology is discussed in terms of foreseen developments with respect to the use of polyatomic primary ions

Ion - biomolecule interactions and radiation damage

International Nuclear Information System (INIS)

Schlathoelter, T.

2004-01-01

fragmentation cross sections as well as kinetic energies of the various primary and secondary species. An important aspect of the current research in this field focuses on collisions of keV (singly and multiply charged) ions with molecules such as water [1,3] and DNA building blocks [2,3,4]. These energies are typical for slowed down heavy ions or protons in the Bragg peak region. Relative and absolute cross sections as well as fragment kinetic energies are measured by means of coincidence time-of-flight spectrometry or fragment ion spectroscopy. Fragment ion kinetic energies exceeding 10 eV are observed in these studies. Recent data on interaction of very low energy ions (0.5 eV - 500 eV) with solid nucleobases showed that ion kinetic energies of less than 5 eV are still sufficient to induce substantial fragmentation [5]. This implies that in the vicinity of a DNA strand break induced by a primary ion, fragment ions migh induce further damage, possibly double strand breaks or clustered lesions. Such biological damage can also be assessed on a larger scale: Ion irradiation of e.g. supported plasmid DNA and subsequent investigation by gel electrophoresis [6] or atomic force microscopy allows quantitative studies of the induced single and double strand breaks

Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometry

International Nuclear Information System (INIS)

Borchardt, G.; Scherrer, H.; Weber, S.; Scherrer, S.

1980-01-01

Local microanalysis of non-conducting surfaces by means of modern physical methods which use charged low-energy primary particles brings about severe problems because of the electrostatic charge accumulated on the sample surface. This is also true of secondary ion mass spectrometry (SIMS) where ions are usually used as primary particles. In the present work the basic features for production of neutral primary beams in commercial SIMS instruments by a simple technique are described. With suitably high sputtering rates, surface analyses and in-depth profiles can be made in reasonable measuring times. Results are given for chemical concentration distributions in the near-surface regions of an oxide glass and for the isotopic diffusion of Si-30 in a crystalline silicate with olivine structure (Co 2 SiO 4 ). (orig.)

Nanometer, submicron and micron sized aluminum powder prepared by semi-solid mechanical stirring method with addition of ceramic particles

International Nuclear Information System (INIS)

Qin, X.H.; Jiang, D.L.; Dong, S.M.

2004-01-01

Composite powder, which is a mixture of Al/Al 2 O 3 composite particles and nanometer, submicron and micron sized aluminum powder, was prepared by semi-solid mechanical stirring method with addition of Al 2 O 3 ceramic particles. The ceramic particles have an average diameter of 80 μm and a volume fraction of 15% in the slurry. The methods used to measure the size distribution of particles greater than 50 μm and less than 50 μm were sieve analysis and photosedimentation, respectively. The surface morphology and transverse sections of the composite powder of different sizes were examined by scanning electron microscope (SEM), optical microscope and auger electron spectroscopy (AES). The results indicate that the composite powder prepared in present work have a wide size distribution ranging from less than 50-900 μm, and the aluminum particles and Al/Al 2 O 3 composite particles are separated and isolated. The particles greater than 200 μm and less than 50 μm are almost pure aluminum powder. The rate of conversion of ingot aluminum into particles less than 1 μm containing nanometer and submicron sizes is 1.777 wt.% in this work. The aluminum powder of different sizes has different shape and surface morphology, quasi-spherical in shape with rough surface for aluminum particles of micron scale, irregular in shape for aluminum particles of submicron scale, and quite close to a globular or an excellent globular in shape for aluminum particles of nanometer size. On the other hand, the surface of ceramic particle was coated by aluminum particles with maximum thickness less than 10 μm containing nanometer and submicron sizes as a single layer. It is suggested that the surface of ceramic particles can provide more nucleation sites for solidification of liquid aluminum and the nucleation of liquid aluminum can take place readily, grow and adhere on the surface of ceramic particles, although it is poorly wetted by the liquid aluminum and the semi-solid slurry can

Ultrahigh-power supercapacitors based on highly conductive graphene nanosheet/nanometer-sized carbide-derived carbon frameworks.

Science.gov (United States)

Yan, Pengtao; Zhang, Xuesha; Hou, Meiling; Liu, Yanyan; Liu, Ting; Liu, Kang; Zhang, Ruijun

2018-06-22

In order to develop energy storage devices with high power performance, electrodes should hold well-defined pathways for efficient ionic and electronic transport. Herein, we demonstrate a highly conductive graphene nanosheet/nanometer-sized carbide-derived carbon framework (hcGNS/nCDC). In this architecture, nCDC possesses short transport paths for electrolyte ions, thus ensuring the rapid ions transportation. The excellent electrical conductivity of hcGNS can reduce the electrode internal resistance for the supercapacitor and thus endows the hcGNS/nCDC composite electrodes with excellent electronic transportation performance. Electrochemical measurements show that the cyclic voltammogram of hcGNS/nCDC can maintain a rectangular-like shape with the increase of the scan rate from 5 mV s -1 to 20 V s -1 , and the specific capacitance retention is up to 51% even at a high scan rate of 20 V s -1 , suggesting ultrahigh power performance, which, to the best of our knowledge, is among the best power performances reported so far for the carbon materials. Furthermore, the hcGNS/nCDC composite also shows an excellent cycling stability (no drop in its capacitance occurs even after 10000 cycles). This work demonstrates the advantage in the ultrahigh power performance for the framework having both short transport pathways for electrolyte ions and high electrical conductivity.

Ultrahigh-power supercapacitors based on highly conductive graphene nanosheet/nanometer-sized carbide-derived carbon frameworks

Science.gov (United States)

Yan, Pengtao; Zhang, Xuesha; Hou, Meiling; Liu, Yanyan; Liu, Ting; Liu, Kang; Zhang, Ruijun

2018-06-01

In order to develop energy storage devices with high power performance, electrodes should hold well-defined pathways for efficient ionic and electronic transport. Herein, we demonstrate a highly conductive graphene nanosheet/nanometer-sized carbide-derived carbon framework (hcGNS/nCDC). In this architecture, nCDC possesses short transport paths for electrolyte ions, thus ensuring the rapid ions transportation. The excellent electrical conductivity of hcGNS can reduce the electrode internal resistance for the supercapacitor and thus endows the hcGNS/nCDC composite electrodes with excellent electronic transportation performance. Electrochemical measurements show that the cyclic voltammogram of hcGNS/nCDC can maintain a rectangular-like shape with the increase of the scan rate from 5 mV s‑1 to 20 V s‑1, and the specific capacitance retention is up to 51% even at a high scan rate of 20 V s‑1, suggesting ultrahigh power performance, which, to the best of our knowledge, is among the best power performances reported so far for the carbon materials. Furthermore, the hcGNS/nCDC composite also shows an excellent cycling stability (no drop in its capacitance occurs even after 10000 cycles). This work demonstrates the advantage in the ultrahigh power performance for the framework having both short transport pathways for electrolyte ions and high electrical conductivity.

Secondary coolant purification system

International Nuclear Information System (INIS)

Stiteler, F.Z.; Donohue, J.P.

1978-01-01

The present invention combines the attributes of volatile chemical addition, continuous blowdown, and full flow condensate demineralization. During normal plant operation (defined as no primary to secondary leakage) condensate from the condenser is pumped through a full flow condensate demineralizer system by the condensate pumps. Volatile chemical additions are made. Dissolved and suspended solids are removed in the condensate polishers by ion exchange and/or filtration. At the same time a continuous blowdown of approximately 1 percent of the main steaming rate of the steam generators is maintained. Radiation detectors monitor the secondary coolant. If these monitors indicate no primary to secondary leakage, the blowdown is cooled and returned directly to the condensate pump discharge. If one of the radiation monitors should indicate a primary to secondary leak, when the temperature of the effluent exiting from the blowdown heat exchanger is compatible with the resin specifications of the ion exchangers, the bypass valve causes the blowdown flow to pass through the blowdown ion exchangers

A novel electrostatic ion-energy spectrometer by the use of a proposed ``self-collection'' method for secondary-electron emission from a metal collector

Science.gov (United States)

Hirata, M.; Nagashima, S.; Cho, T.; Kohagura, J.; Yoshida, M.; Ito, H.; Numakura, T.; Minami, R.; Kondoh, T.; Nakashima, Y.; Yatsu, K.; Miyoshi, S.

2003-03-01

For the purpose of end-loss-ion energy analyses in open-field plasmas, a newly developed electrostatic ion-energy spectrometer is proposed on the basis of a "self-collection" principle for secondary-electron emission from a metal collector. The ion-energy spectrometer is designed with multiple grids for analyzing incident ion energies, and a set of parallelly placed metal plates with respect to lines of ambient magnetic forces in an open-ended device. One of the most important characteristic properties of this spectrometer is the use of our proposed principle of a "self-collection" mechanism due to E×B drifts for secondary electrons emitted from the grounded metal-plate collector by the use of no further additional magnetic systems except the ambient open-ended fields B. The proof-of-principle and characterization experiments are carried out by the use of a test-ion-beam line along with an additional use of a Helmholtz coil system for the formation of open magnetic fields similar to those in the GAMMA 10 end region. The applications of the developed ion-energy spectrometer for end-loss-ion diagnostics in the GAMMA 10 plasma experiments are demonstrated under the conditions with simultaneous incidence of energetic electrons produced by electron-cyclotron heatings for end-loss-plugging potential formation, since these electrons have contributed to disturb these ion signals from conventional end-loss-ion detectors.

Electrochemical characterization of carbon coated bundle-type silicon nanorod for anode material in lithium ion secondary batteries

International Nuclear Information System (INIS)

Halim, Martin; Kim, Jung Sub; Choi, Jeong-Gil; Lee, Joong Kee

2015-01-01

Highlights: • Bundle-type silicon nanorods (BSNR) were synthesized by metal assisted chemical etching. • Novel bundle-type nanorods electrode showed self-relaxant characteristics. • The self-relaxant property was enhanced by increasing the silver concentration. • PAA binder enhanced the self-relaxant property of the silicon material. • Carbon coated BSNR (BSNR@C) has evidently provided better cycle performance. - Abstract: Nanostructured silicon synthesis by surface modification of commercial micro-powder silicon was investigated in order to reduce the maximum volume change over cycle. The surface of micro-powder silicon was modified using an Ag metal-assisted chemical etching technique to produce nanostructured material in the form of bundle-type silicon nanorods. The volume change of the electrode using the nanostructured silicon during cycle was investigated using an in-situ dilatometer. Our result shows that nanostructured silicon synthesized using this method showed a self-relaxant characteristic as an anode material for lithium ion battery application. Moreover, binder selection plays a role in enhancing self-relaxant properties during delithiation via strong hydrogen interaction on the surface of the silicon material. The nanostructured silicon was then coated with carbon from propylene gas and showed higher capacity retention with the use of polyacrylic acid (PAA) binder. While the nano-size of the pore diameter control may significantly affect the capacity fading of nanostructured silicon, it can be mitigated via carbon coating, probably due to the prevention of Li ion penetration into 10 nano-meter sized pores

Electrochemical characterization of carbon coated bundle-type silicon nanorod for anode material in lithium ion secondary batteries

Energy Technology Data Exchange (ETDEWEB)

Halim, Martin [Center for Energy Convergence, Korea Institute of Science and Technology, Hwarangno 14-gil 5, Seongbuk-gu, Seoul 136-791 (Korea, Republic of); Energy and Environmental Engineering, Korea University of Science and Technology, Gwahangno, Yuseong-gu, Daejeon, 305-333 (Korea, Republic of); Kim, Jung Sub [Center for Energy Convergence, Korea Institute of Science and Technology, Hwarangno 14-gil 5, Seongbuk-gu, Seoul 136-791 (Korea, Republic of); Department of Material Science & Engineering, Korea University, Seoul 136-713 (Korea, Republic of); Choi, Jeong-Gil [Department of Chemical Engineering, Hannam University, 461-1 Junmin-dong, Yusung-gu, Taejon 305-811 (Korea, Republic of); Lee, Joong Kee, E-mail: leejk@kist.re.kr [Center for Energy Convergence, Korea Institute of Science and Technology, Hwarangno 14-gil 5, Seongbuk-gu, Seoul 136-791 (Korea, Republic of); Energy and Environmental Engineering, Korea University of Science and Technology, Gwahangno, Yuseong-gu, Daejeon, 305-333 (Korea, Republic of)

2015-04-15

Highlights: • Bundle-type silicon nanorods (BSNR) were synthesized by metal assisted chemical etching. • Novel bundle-type nanorods electrode showed self-relaxant characteristics. • The self-relaxant property was enhanced by increasing the silver concentration. • PAA binder enhanced the self-relaxant property of the silicon material. • Carbon coated BSNR (BSNR@C) has evidently provided better cycle performance. - Abstract: Nanostructured silicon synthesis by surface modification of commercial micro-powder silicon was investigated in order to reduce the maximum volume change over cycle. The surface of micro-powder silicon was modified using an Ag metal-assisted chemical etching technique to produce nanostructured material in the form of bundle-type silicon nanorods. The volume change of the electrode using the nanostructured silicon during cycle was investigated using an in-situ dilatometer. Our result shows that nanostructured silicon synthesized using this method showed a self-relaxant characteristic as an anode material for lithium ion battery application. Moreover, binder selection plays a role in enhancing self-relaxant properties during delithiation via strong hydrogen interaction on the surface of the silicon material. The nanostructured silicon was then coated with carbon from propylene gas and showed higher capacity retention with the use of polyacrylic acid (PAA) binder. While the nano-size of the pore diameter control may significantly affect the capacity fading of nanostructured silicon, it can be mitigated via carbon coating, probably due to the prevention of Li ion penetration into 10 nano-meter sized pores.

Multilayered nanostructured coverings generated by a method of ion beam sputtering in vacuum

International Nuclear Information System (INIS)

Il'yushenko, A.F.; Andreev, M.A.; Markova, L.V.; Lisovskaya, Yu. O.

2013-01-01

Technological process of the formation of multilayered coverings by ion -beam sputtering is developed. At research of samples by method of AFM it is established, that the heating of a substrate leads to formation of rather large grains up to 100 nanometers in size, consisting of dispersed subgrains in the size 10-25 nanometers. The obtained results allow to say that in the course of formation of coverings interphase borders of section in one layer and section border between coat layers are formed. The use of a method of Electron Backscatter Diffraction Analysis (EBSD) has helped to confirm that the at ion-beam sputtering, ultrafine diamonds remain their diamond-like structure when migrating to the surface of the coating. It is found that with increasing number of monolayers coating microhardness increases. However, this relationship is described by a nonlinear and exponential model. (authors)

Astrophysical gyrokinetics: turbulence in pressure-anisotropic plasmas at ion scales and beyond

Science.gov (United States)

Kunz, M. W.; Abel, I. G.; Klein, K. G.

2018-04-01

We present a theoretical framework for describing electromagnetic kinetic turbulence in a multi-species, magnetized, pressure-anisotropic plasma. The turbulent fluctuations are assumed to be small compared to the mean field, to be spatially anisotropic with respect to it and to have frequencies small compared to the ion cyclotron frequency. At scales above the ion-Larmor radius, the theory reduces to the pressure-anisotropic generalization of kinetic reduced magnetohydrodynamics (KRMHD) formulated by Kunz et al. (J. Plasma Phys., vol. 81, 2015, 325810501). At scales at and below the ion-Larmor radius, three main objectives are achieved. First, we analyse the linear response of the pressure-anisotropic gyrokinetic system, and show it to be a generalization of previously explored limits. The effects of pressure anisotropy on the stability and collisionless damping of Alfvénic and compressive fluctuations are highlighted, with attention paid to the spectral location and width of the frequency jump that occurs as Alfvén waves transition into kinetic Alfvén waves. Secondly, we derive and discuss a very general gyrokinetic free-energy conservation law, which captures both the KRMHD free-energy conservation at long wavelengths and dual cascades of kinetic Alfvén waves and ion entropy at sub-ion-Larmor scales. We show that non-Maxwellian features in the distribution function change the amount of phase mixing and the efficiency of magnetic stresses, and thus influence the partitioning of free energy amongst the cascade channels. Thirdly, a simple model is used to show that pressure anisotropy, even within the bounds imposed on it by firehose and mirror instabilities, can cause order-of-magnitude variations in the ion-to-electron heating ratio due to the dissipation of Alfvénic turbulence. Our theory provides a foundation for determining how pressure anisotropy affects turbulent fluctuation spectra, the differential heating of particle species and the ratio of parallel

Wave packet study of the secondary emission of negatively charged, monoatomic ions from sputtered metals

Energy Technology Data Exchange (ETDEWEB)

Sindona, A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy) and Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)]. E-mail: sindona@fis.unical.it; Riccardi, P. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Maletta, S. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Rudi, S.A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Falcone, G. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)

2007-05-15

Secondary emission of Ag{sup -} and Au{sup -} particles, following the sputtering of clean Ag(1 0 0) and Au(1 0 0) targets, respectively, is studied with a Crank-Nicholson wave-packet propagation method. A one-electron pseudo-potential is used to describe the plane metal surface, with a projected band gap, the ejected ion, whose charge state is investigated, and its nearest-neighbor substrate ion, put in motion by the collision cascade generated by the primary ion beam. Time-dependent Schroedinger equation is solved backwards in time to determine the evolution of the affinity orbital of the negative particles from an instant when they are unperturbed, at distances of the order of {approx}10{sup 2} a.u. from the surface, to the instant of ejection. The probability that a band electron will be eventually detected in affinity state of the ejected particle is, thus, calculated and compared with the result of another method based on the spectral decomposition of the one-electron Hamiltonian.

Spinel Li2CoTi3O8 nanometer obtained for application as pigment

International Nuclear Information System (INIS)

Costa de Camara, M. S.; Alves Pimentel, L.; Longo, E.; Nobrega Azevedo, L. da; Araujo Melo, D. M. de

2016-01-01

Pigments are used in ceramics, cosmetics, inks, and other applications widely materials. To this must be single and easily reproducible. Moreover, the pigments obtained in the nanoscale are more stable, reproducible and highlight color in small amounts compared with those obtained in micrometer scale. The mixed oxides with spinel structures AB 2 O 4 have important applications, including: pigments, refractories, catalytic and electronic ceramics. In this context, the aim of this work was the preparation of powder Li 2 CoTi 3 O 8 spinel phase with nanometer particle size of the polymeric precursor method (Pechini) and characterization by means of thermal analysis (TG/DTA) X-ray diffraction (XRD), refined by the Rietveld method, BET, transmission electron microscopy (TEM), Raman and colorimetric coordinates. The pigment was obtained by heat treatment of 400 degree centigrade to 1000 degree centigrade after pyrolysis at 300 degree centigrade/1 h for removing the organic material. Li 2 CoTi 3 O 8 desired spinel phase was obtained from 500 degree centigrade, and presenting stability nanometer to about 1.300 degree centigrade. Spinel green phase introduced at temperatures in the range of 400 degree centigrade and 500 degree centigrade, and 600 degree centigrade at temperatures between blue and 1000 degree centigrade. (Author)

The gyro-radius scaling of ion thermal transport from global numerical simulations of ITG turbulence

International Nuclear Information System (INIS)

Ottaviani, M.; Manfredi, G.

1998-12-01

A three-dimensional, fluid code is used to study the scaling of ion thermal transport caused by Ion-Temperature-Gradient-Driven (ITG) turbulence. The code includes toroidal effects and is capable of simulating the whole torus. It is found that both close to the ITG threshold and well above threshold, the thermal transport and the turbulence structures exhibit a gyro-Bohm scaling, at least for plasmas with moderate poloidal flow. (author)

Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.

Science.gov (United States)

Delcorte, A; Médard, N; Bertrand, P

2002-10-01

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been covered with 2-60 nmol of gold/cm2 in order to enhance the ionization efficiency for static secondary ion mass spectrometry (s-SIMS) measurements. Au-cationized molecules (up to -3,000 Da) and fragments (up to the trimer) are observed in the positive mass spectra of metallized polystyrene (PS) oligomer films. Beyond 3,000 Da, the entanglement of polymer chains prevents the ejection of intact molecules from a "thick" organic film. This mass limit can be overcome by embedding the polymer chains in a low-molecular-weight matix. The diffusion of organic molecules over the metal surfaces is also demonstrated for short PS oligomers. In the case of high-molecular-weight polymers (polyethylene, polypropylene, PS) and polymer additives (Irganox 1010, Irgafos 168), the metallization procedure induces a dramatic increase of the fingerprint fragment ion yields as well as the formation of new Aucationized species that can be used for chemical diagnostics. In comparison with the deposition of submonolayers of organic molecules on metallic surfaces, metal evaporation onto organic samples provides a comparable sensitivity enhancement. The distinct advantage of the metal evaporation procedure is that it can be used for any kind of organic sample, irrespective of thickness, opening new perspectives for "real world" sample analysis and chemical imaging by s-SIMS.

Behavior of PET implanted by Ti, Ag, Si and C ion using MEVVA implantation

International Nuclear Information System (INIS)

Wu Yuguang; Zhang Tonghe; Zhang Yanwen; Zhang Huixing; Zhang Xiaoji; Zhou Gu

2001-01-01

Polyethylene terephthalane (PET) has been modified with Ti, Ag, Si and C ions from a metal vapor arc source (MEVVA). Ti, Ag, Si and C ions were implanted with acceleration voltage 40 kV to fluences ranging from 1x10 16 to 2x10 17 cm -2 . The surface of implanted PET darkened with increasing ion dose, when the metal ion dose was greater than 1x10 17 cm -2 the color changed to metallic bright. The surface resistance decreases by 5-6 orders of magnitude with increasing dose. The resistivity is stable after long-term storage. The depth of Ti- and Ag-implanted layer is approximately 150 and 80 nm measured by Rutherford backscattering (RBS), respectively. TEM photos revealed the presence of Ti and Ag nano-meter particles on the surface resulting from the high-dose implantation. Ti and Ag ion implantations improved conductivity and wear resistance significantly. The phase and structural changes were obtained by X-ray diffraction (XRD). It can be seen that nano-meter particles of Ti precipitation, TiO 2 and Ti-carbides have been formed in implanted layer. Nano-hardness of implanted PET has been measured by a nano-indenter. The results show that the surface hardness, modulus and wear resistance could be increased

Characterisation of AGR fuel cladding alloy using secondary ion mass spectrometry

International Nuclear Information System (INIS)

Allen, G.C.; Sparry, R.P.; Wild, R.K.

1987-08-01

Uranium dioxide fuel used in the Advanced Gas Cooled Reactor (AGR) is contained in a ribbed can of 20wt%Cr/25wt%Ni/Nb stabilised steel. Laboratory circumstances, spall during thermal cycling. To date it has been difficult to identify active material originating from the oxidation product of the cladding alloy in the cooling circuit. In an attempt to solve this problem we have set out to characterise fully a sample of oxide from this source and work is in progress to obtain suitable oxide samples from the surface of a 20%Cr/25%Ni/Nb stainless steel. In view of its high sensitivity and the ability to obtain chemical information from relatively small areas we have sought to use Secondary Ion Mass Spectroscopy (SIMS). (author)

Focused-ion-beam nano-structuring of photonic cavities in dielectric materials

NARCIS (Netherlands)

Ay, F.; Pollnau, Markus

Focused ion beam (FIB) milling is an emerging technology that enables fast, reliable and well-controlled nanometer-size feature definition. In this work we will discuss applications of the tool in the area of photonics. The FIB technique can be adapted and optimized almost for any material system

Nanostructure and Properties of Corrosion Resistance in C+Ti Multi-Ion-Implanted Steel

Institute of Scientific and Technical Information of China (English)

张通和; 吴瑜光; 刘安东; 张旭; 王晓妍

2003-01-01

The corrosion and pitting corrosion resistance of C+ Ti dual and C+Ti+C ternary implanted H13 steel were studied by using a multi-sweep cyclic voltammetry and a scanning electron microscope. The effects of phase formation on corrosion and pitting corrosion resistance were explored. The x-ray diffraction analysis shows that the nanometer-sized precipitate phases consist of compounds of Fe2 Ti, TiC, Fe2C and Fe3 C in dual implanted layer and even in ternary implanted layer. The passivation layer consists of these nanometer phases. It has been found that the corrosion and pitting corrosion resistance of dual and ternary implanted H13 steel are improved extremely. The corrosion resistance of ternary implanted layer is better than that of dual implantations and is enhanced with the increasing ion dose. When the ion dose of Ti is 6 × 1017/cm2 in the ternary implantation sample, the anodic peak current density is 95 times less than that of the H13 steel. The pitting corrosion potential of dual and ternary implantation samples is in the range from 55mV to 160mV which is much higher than that of the H13 steel. The phases against the corrosion and pitting corrosion are nanometer silkiness phases.

Experiments of Nanometer Spot Size Monitor at FETB Using Laser Interferometry

CERN Document Server

Walz, D

2003-01-01

The nanometer spot size monitor based on the laser interferometry has been developed and installed in the final focus test beam (FFTB) line at SLAC. The beam experiments started in September 1993, the first fringe pattern from the monitor was observed in the beginning of April 1994, then the small vertical spot around 70 nm was observed in May 1994. The spot size monitor has been routinely used for tuning the beam optics in FFTB. Basic principle of this monitor has been well proved, and its high performance as a precise beam monitor in nanometer range has been demonstrated.

Defects induced by swift heavy ions in the 18R martensite of Cu-Zn-Al alloy

International Nuclear Information System (INIS)

Zelaya, Eugenia; Tolley, Alfredo; Condo, Adriana; Lovey, Francisco; Schumacher, G

2003-01-01

The swift heavy ion incidence over the surface of a given material produces a strong energy deposition in a nanometric scale.Swift heavy ions, of the order of one thousand of MeV, deposit their energy as electronic excitations.This highly localized deposition can induce metastable transformations within the material. For example, in martensitic NiTi alloys irradiated with swift heavy ions, it has been observed changes on the martensitic transformation temperature and amorphous areas induced by the irradiation.In this work, the effects produced by swift heavy ions on the martensitic 18R structure of Cu-Zn-Al alloy (Cu - 12.17 Zn - 17.92 Al, in %at) were analyzed.Crystalline samples were irradiated in a direction close to the [2 1 0] of 18R with Xe + 230 MeV, Au + of 350 MeV and Kr + of 200 MeV ion beams.Defects of the order of nanometers induced by the irradiation were observed by transmission electron microscopy (TEM) and high resolution electron microscopy (HREM).It was also observed, that the average size of the irradiation defects induced by Au + ion is larger than those induced by Xe + and Kr + ions.In this case, no relationship between the observed defects and the energy deposition was found in the 23 keV/nn to 48 keV/nn range

Evidence for radical anion formation during liquid secondary ion mass spectrometry analysis of oligonucleotides and synthetic oligomeric analogues: a deconvolution algorithm for molecular ion region clusters.

Science.gov (United States)

Laramée, J A; Arbogast, B; Deinzer, M L

1989-10-01

It is shown that one-electron reduction is a common process that occurs in negative ion liquid secondary ion mass spectrometry (LSIMS) of oligonucleotides and synthetic oligonucleosides and that this process is in competition with proton loss. Deconvolution of the molecular anion cluster reveals contributions from (M-2H).-, (M-H)-, M.-, and (M + H)-. A model based on these ionic species gives excellent agreement with the experimental data. A correlation between the concentration of species arising via one-electron reduction [M.- and (M + H)-] and the electron affinity of the matrix has been demonstrated. The relative intensity of M.- is mass-dependent; this is rationalized on the basis of base-stacking. Base sequence ion formation is theorized to arise from M.- radical anion among other possible pathways.

Flip-flop design in nanometer CMOS from high speed to low energy

CERN Document Server

Alioto, Massimo; Palumbo, Gaetano

2015-01-01

This book provides a unified treatment of Flip-Flop design and selection in nanometer CMOS VLSI systems. The design aspects related to the energy-delay tradeoff in Flip-Flops are discussed, including their energy-optimal selection according to the targeted application, and the detailed circuit design in nanometer CMOS VLSI systems. Design strategies are derived in a coherent framework that includes explicitly nanometer effects, including leakage, layout parasitics and process/voltage/temperature variations, as main advances over the existing body of work in the field. The related design tradeoffs are explored in a wide range of applications and the related energy-performance targets. A wide range of existing and recently proposed Flip-Flop topologies are discussed. Theoretical foundations are provided to set the stage for the derivation of design guidelines, and emphasis is given on practical aspects and consequences of the presented results. Analytical models and derivations are introduced when needed to gai...

Direct energy recovery from helium ion beams by a beam direct converter with secondary electron suppressors

International Nuclear Information System (INIS)

Yoshikawa, K.; Yamamoto, Y.; Toku, H.; Kobayashi, A.; Okazaki, T.

1989-01-01

A 5-yr study of beam direct energy conversion was performed at the Kyoto University Institute of Atomic Energy to clarify the essential features of direct energy recovery from monoenergetic ion beams so that the performance characteristics of energy recovery can be predicted reasonably well by numerical calculations. The study used an improved version of an electrostatically electron-suppressed beam direct converter. Secondary electron suppressor grids were added, and a helium ion beam was used with typical parameters of 15.4 keV, 90 mA, and 100 ms. This paper presents a comparison of experimental results with numerical results by the two-dimensional Kyoto University Advanced Dart (KUAD) code, including evaluation of atomic processes

Self-sputtering runaway in high power impulse magnetron sputtering: The role of secondary electrons and multiply charged metal ions

International Nuclear Information System (INIS)

Anders, Andre

2008-01-01

Self-sputtering runaway in high power impulse magnetron sputtering is closely related to the appearance of multiply charged ions. This conclusion is based on the properties of potential emission of secondary electrons and energy balance considerations. The effect is especially strong for materials whose sputtering yield is marginally greater than unity. The absolute deposition rate increases ∼Q 1/2 , whereas the rate normalized to the average power decreases ∼Q -1/2 , with Q being the mean ion charge state number

Sub-50 nm Scale to Micrometer Scale Soft Lithographic Patterning of Functional Materials

NARCIS (Netherlands)

George, A.

2011-01-01

This PhD thesis addresses two major issues: 1) Fabricating nanometer-scale patterns of functional materials, 2) Extending the applicability of soft lithographic processes to a wide range of functional materials on conventional silicon substrates and flexible plastic substrates. This thesis describes

Recoil ion spectroscopy with heavy ions

International Nuclear Information System (INIS)

Beyer, H.F.; Mann, R.

1984-01-01

This chapter examines the production of very high charge state ions in single ion-atom collisions. Topics considered include some aspects of highly ionized atoms, experimental approaches, the production of highly charged target ions (monoatomic targets, recoil energy distribution, molecular fragmentation, outer-shell rearrangement, lifetime measurements, a comparison of projectile-, target-, and plasma-ion stripping), and secondary collision experiments (selective electron capture, potential applications). The heavy-ion beams for the described experiments were provided by accelerators such as tandem Van de Graaff facility and the UNILAC

Determination of B and Li in nuclear materials by secondary-ion mass spectrometry

International Nuclear Information System (INIS)

Eby, R.E.; Christie, W.H.

1981-01-01

Secondary ion mass spectrometry (SIMS) was used to perform mass and isotopic analysis for B and Li in samples that are not readily amenable to more conventional mass spectrometric techniques (e.g., surface ionization, electron impact, etc.). In this paper three specific applications of SIMS analysis to nuclear materials are discussed: first, the quantitative determination of B and its isotopic composition in borosilicate glasses; second, the determination of the isotopic composition of B and Li in irradiated nuclear-grade aluminum oxide/boron carbide composite pellets, and, lastly, the quantitative and isotopic determination of B and Li in highly radioactive solutions of unknown composition

Desorption of Cs+ ions with fast incident atomic and molecular ions

International Nuclear Information System (INIS)

Salehpour, M.; Hunt, J.E.; Tou, L.C.; Hedin, A.; Sundqvist, B.

1988-01-01

Preliminary results on desorption yield measurements of secondary Cs + ions, desorbed as a result of the impact of C + , O + , CO + , O 2 + , CO 2 + and C 4 H 9 + incident ions, in the energy range of 950 keV--3.5 MeV are presented. Molecular beams are found to give high yields of secondary Cs + as a result of impact of O 2 + compared to O + incident ions, indicate no ''collective'' molecular effects. 23 refs., 1 fig

Medium scale test study of chemical cleaning technique for secondary side of SG in PWR

International Nuclear Information System (INIS)

Zhang Mengqin; Zhang Shufeng; Yu Jinghua; Hou Shufeng

1997-08-01

The medium scale test study of chemical cleaning technique for removing corrosion product (Fe 3 O 4 ) in secondary side of SG in PWR has been completed. The test has been carried out in a medium scale test loop. The medium scale test evaluated the effect of the chemical cleaning technique (temperature, flow rate, cleaning time, cleaning process), the state of corrosion product deposition on magnetite (Fe 3 O 4 ) solubility and safety of materials of SG in cleaning process. The inhibitor component of chemical cleaning agent has been improved by electrochemical linear polarization method, the effect of inhibitor on corrosion resistance of materials have been examined in the medium scale test loop, the most components of chemical cleaning agent have been obtained, the EDTA is main component in cleaning agent. The electrochemical method for monitor corrosion of materials during cleaning process has been completed in the laboratory. The study of the medium scale test of chemical cleaning technique have had the optimum chemical cleaning technique for remove corrosion product in SG secondary side of PWR. (9 refs., 4 figs., 11 tabs.)

Improved Technique for the Determination of Uranium Minor Isotopes Concentrations in Microparticles by Using Secondary Ion Mass-Spectrometer in Multicollection Mode

International Nuclear Information System (INIS)

Aleshin, M.; Elantyev, I.; Stebelkov, Y.

2015-01-01

Traditional method of the analysis implies simultaneous measuring of secondary ion currents of isotopes 234U + , 235U + , 238U + , ions with mass 236 amu (236U + and 235UH + ) and hydride ions 238UH + by using mass-spectrometer Cameca IMS1280 in multicollection mode. Calculating of uranium isotopic composition is performed using the results of 40 successive measurements of those currents (cycles). Duration of each measurement is 8 s. Small amounts of uranium minor isotopes are limitation for precise determination of their concentrations. To prevent the damage of the secondary ions detector the intensity of ion current should be no more than 5 x 10 5 s -1 . This limitation does not allow setting a higher primary ion current for the increasing of minor uranium isotopes ions emission because of the signal of ions 238U + gets too high. New technique is developed to improve the accuracy of determination of uranium minor isotopes concentrations. Process of measurement is divided on two steps. First step is a measurement of ion currents during 20 cycles by five detectors. The second step implies the elimination of ions 238U + hitting to the detector and 10 times increasing of primary ion current. The ratio 235U/238U is calculated from the first step results, so uncertainty of determination of this value is 1.4 times bigger than with duration of 40 cycles of the measurement. The ratios 234U/235U and 236U/235U are calculated during the second step. This technique allows to determine content of 234U and 236U with 3 and 5 times less uncertainties respectively, but with different degree of the sputtering particles. Moreover the duration of each cycle was set less (1 second) to use data more efficient. The technique accordingly with every second counting provides uncertainty of determination 236U concentration 4 times less than traditional method at the same degree of sputtering particles. (author)

Nanometer-sized emissions from municipal waste incinerators: A qualitative risk assessment

Energy Technology Data Exchange (ETDEWEB)

Johnson, David R., E-mail: david.r.johnson@ghd.com

2016-12-15

Municipal waste incinerators (MWI) are beneficial alternatives to landfills for waste management. A recent constituent of concern in emissions from these facilities is incidental nanometer-sized particles (INP{sub MWI}), i.e., particles smaller than 1 micrometer in size that may deposit in the deepest parts of the lungs, cross into the bloodstream, and affect different regions of the body. With limited data, the public may fear INP{sub MWI} due to uncertainty, which may affect public acceptance, regulatory permitting, and the increased lowering of air quality standards. Despite limited data, a qualitative risk assessment paradigm can be applied to determine the relative risk due to INP{sub MWI} emissions. This review compiles existing data on nanometer-sized particle generation by MWIs, emissions control technologies used at MWIs, emission releases into the atmosphere, human population exposure, and adverse health effects of nanometer-sized particles to generate a qualitative risk assessment and identify data gaps. The qualitative risk assessment conservatively concludes that INP{sub MWI} pose a low to moderate risk to individuals, primarily due to the lack of relevant toxicological data on INP{sub MWI} mixtures in ambient particulate matter.

Secondary ion mass spectrometry induced damage adjacent to analysis craters in silicon

International Nuclear Information System (INIS)

Clark, M.H.; Jones, K.S.; Stevie, F.A.

2002-01-01

Damage introduced by dynamic secondary ion mass spectrometry (SIMS) depth profiling is studied. A silicon sample with a boron marker layer was depth profiled by dynamic SIMS. After subsequent annealing at 750 deg. C for 30 min, the SIMS sample was reanalyzed by plan-view transmission electron microscope (PTEM) and SIMS. PTEM images showed the presence of interstitial defects near the original SIMS crater, and SIMS depth profiles of similar regions exhibited boron diffusivity enhancements. Excess interstitials were introduced into the Si surface up to 2 mm from the original 225 μmx225 μm crater. Both PTEM and SIMS results showed that the damage and its effects diminished with an increase in distance from the original crater

The use of secondary ion mass spectrometry for uranium analysis in bioassays

International Nuclear Information System (INIS)

Amaral, Ademir de Jesus

1997-01-01

Today many researches are performed to use mass spectrometry as complementary methods to the alpha spectrometry. In this study performance of the secondary ion mass spectrometry (SIMS) are evaluated for traces of uranium analysis in biological tissues and more particularly in urine. A special attention is done for the samples preparation, using thin polymers. the SIMS method feasibility is presented. The second part of the thesis deals with the use of a tracer to quantify the urinary uranium, the 233 U. The isotopic ratio are obtained with a detection limit of 10 -6 Bq in 238 U per urine litre. Other biological samples are studied to illustrate the adaptability of the SIMS method to internal dosimetry. (A.L.B.)

Theoretical study and simulation for a nanometer laser based on Gauss–Hermite source expansion

International Nuclear Information System (INIS)

Gu, Xiaowei

2013-01-01

Recently there has been worldwide interest in constructing a new generation of continuously tunable nanometer lasers for a wide range of scientific applications, including femtosecond science, biological molecules, nanoscience research fields, etc. The high brightness electron beam required by a short wavelength self-amplified spontaneous emission FEL can be reached only with accurate control of the beam dynamics in the facility. Numerical simulation codes are basic tools for designing new nanometer laser devices. We have developed a MATLAB quasi-one-dimensional code based on a reduced model for the FEL. The model uses an envelope description of the transverse dynamics of the laser beam and full longitudinal particle motion. We have optimized the LCLS facility parameters, then given the characteristics of the nanometer laser. (letter)

Theoretical study and simulation for a nanometer laser based on Gauss-Hermite source expansion

Science.gov (United States)

Gu, Xiaowei

2013-07-01

Recently there has been worldwide interest in constructing a new generation of continuously tunable nanometer lasers for a wide range of scientific applications, including femtosecond science, biological molecules, nanoscience research fields, etc. The high brightness electron beam required by a short wavelength self-amplified spontaneous emission FEL can be reached only with accurate control of the beam dynamics in the facility. Numerical simulation codes are basic tools for designing new nanometer laser devices. We have developed a MATLAB quasi-one-dimensional code based on a reduced model for the FEL. The model uses an envelope description of the transverse dynamics of the laser beam and full longitudinal particle motion. We have optimized the LCLS facility parameters, then given the characteristics of the nanometer laser.

Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding

Science.gov (United States)

Wittmaack, Klaus

2013-03-01

Exposure of ion bombarded solids to Cs gives rise to a very strong enhancement of the yields of negatively charged secondary ions and, concurrently, to a lowering of positive ion yields. The phenomena have been explored in a large number of experimental and theoretical studies but attempts to clarify the mechanism of ion formation were not as successful as assumed. This review examines the state of the art in Cs controlled secondary ion mass spectrometry (SIMS) in great detail, with due consideration of low-energy alkali-ion scattering. In very basic studies on alkali induced secondary ion yield changes, sub-monolayer quantities of Cs or Li were deposited on the sample surface, followed by low-fluence ion bombardment, to avoid significant damage. If SIMS is applied to characterise the composition of solid materials, the simplest approach to achieving sample erosion as well as high negative-ion yields is bombardment with primary ions of Cs. Two other methods of sample loading with Cs provide more flexibility, (i) exposure to a collimated beam of Cs vapour and concurrent bombardment with high-energy non-Cs ions and (ii) the mixed-beam approach involving quasi-simultaneous bombardment with Cs and Xe ions. Both concepts have the advantage that undesirable sample overload with Cs can be avoided. High Cs concentrations reduce the formation probability of target specific molecular ions and lower the yields of all types of positive secondary ions, including Cs+, M+, X+, MCs+ and XCs+ (M and X denoting matrix and impurity elements). Quantitative SIMS analysis using MCs+ and XCs+ ions appears feasible, provided the Cs coverage is kept below about 5%. The semi-classical model of resonant charge transfer, also known as the tunnelling model, has long been considered a solid framework for the interpretation of Cs and Li based SIMS data. The model predicts ionisation probabilities for cases in which, at shallow distances from the surface, the affinity (ionisation) level of the

Shearing Nanometer-Thick Confined Hydrocarbon Films: Friction and Adhesion

DEFF Research Database (Denmark)

Sivebæk, I. M.; Persson, B. N. J.

2016-01-01

We present molecular dynamics (MD) friction and adhesion calculations for nanometer-thick confined hydrocarbon films with molecular lengths 20, 100 and 1400 carbon atoms. We study the dependency of the frictional shear stress on the confining pressure and sliding speed. We present results...

Controlling the nanoscale morphology of organic films deposited by polyatomic ions

CERN Document Server

Hanley, L; Fuoco, E R; Ahu-Akin, F; Wijesundara, M B J; Li, Maozhen; Tikhonov, A; Schlossman, M

2003-01-01

Hyperthermal polyatomic ion beams can be used to fabricate thin film nanostructures with controlled morphology. Several experiments are described in which mass-selected and non-mass-selected polyatomic ion beams are used to create nanometer thick films with controlled surface and buried interface morphologies. Fluorocarbon and thiophenic films are grown on silicon wafers and/or polystyrene from 5 to 200 eV C sub 3 F sub 5 sup + or C sub 4 H sub 4 S sup + ions, respectively. X-ray photoelectron spectroscopy, atomic force microscopy, X-ray reflectivity, and scanning electron microscopy are utilized to analyze the morphology and chemistry of these films. Polyatomic ions are found to control film morphology on the nanoscale through variation of the incident ion energy, ion structure and/or substrate.

Characterization of graphite etched with potassium hydroxide and its application in fast-rechargeable lithium ion batteries

Science.gov (United States)

Shim, Jae-Hyun; Lee, Sanghun

2016-08-01

Surface-modified graphite for application as an anode material in lithium ion batteries was obtained by etching with KOH under mild conditions without high-temperature annealing. The surface of the etched graphite is covered with many nano-sized pores that act as entrances for lithium ions during the charging process. As compared with pristine graphite and other references such as pitch-coated or etched graphite samples with annealing, our non-annealed etched graphite exhibits excellent electrochemical properties, particularly at fast charging rates of over 2.5 C. While avoidance of the trade-off between increase of irreversible capacity and good rate capability has previously been a main concern in highly porous carbonaceous materials, we show that the slightly larger surface area created by the etching does not induce a significant increase of irreversible capacity. This study shows that it is important to limit the size of pores to the nanometer scale for excellent battery performance, which is possible by etching under relatively mild conditions.

Fractal and multifractal characteristics of swift heavy ion induced self-affine nanostructured BaF{sub 2} thin film surfaces

Energy Technology Data Exchange (ETDEWEB)

Yadav, R. P.; Mittal, A. K. [Department of Physics, University of Allahabad, Allahabad 211002 (India); Kumar, Manvendra, E-mail: kmanav@gmail.com; Pandey, A. C. [Nanotechnology Application Centre, University of Allahabad, Allahabad 211002 (India)

2015-08-15

Fractal and multifractal characteristics of self-affine surfaces of BaF{sub 2} thin films, deposited on crystalline Si 〈1 1 1〉 substrate at room temperature, were studied. Self-affine surfaces were prepared by irradiation of 120 MeV Ag{sup 9+} ions which modified the surface morphology at nanometer scale. The surface morphology of virgin thin film and those irradiated with different ion fluences are characterized by atomic force microscopy technique. The surface roughness (interface width) shows monotonic decrease with ion fluences, while the other parameters, such as lateral correlation length, roughness exponent, and fractal dimension, did not show either monotonic decrease or increase in nature. The self-affine nature of the films is further confirmed by autocorrelation function. The power spectral density of thin films surfaces exhibits inverse power law variation with spatial frequency, suggesting the existence of fractal component in surface morphology. The multifractal detrended fluctuation analysis based on the partition function approach is also performed on virgin and irradiated thin films. It is found that the partition function exhibits the power law behavior with the segment size. Moreover, it is also seen that the scaling exponents vary nonlinearly with the moment, thereby exhibiting the multifractal nature.

Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

International Nuclear Information System (INIS)

Wright, R.B.; Gruen, D.M.

1980-01-01

Secondary photon and secondary ion emission during energetic particle irradiation of solid surfaces is assumed to arise due to excitation and de-excitation of sputtered particles originating from a collision cascade induced by the incident projectile. The excitation is postulated to occur by two alternative mechanisms: path (a), where excitation occurs at or very near the surface of the solid due to atom--atom or atom--electron collisions; and path (b), where excitation occurs as the sputtered particle leaves the solid, but is still under its influence so that electron exchange processes are permitted. Once the excited and/or ionized sputtered particle is formed nonradiative de-excitation processes are then included in the discussion which allow the excited and/or ionized particle to be de-excited and/or neutralized. The result of these nonradiative de-excitation processes is shown to provide a possible channel for the formation of new excited ''daughters'' by the de-excitation of the initial excited ''parent''. Depending on the initial excitation probability of the parent the new excited daughters are shown to contribute to various energy regions of the excited and/or ionized secondary particle energy distribution. A mathematical formalism is developed based on the neutral sputtered atom energy and velocity distributions assuming a collision cascade origin for these sputtered particles. By including various models for the excitation probability, and the survival probability for excited particles once formed to not undergo nonradiative de-excitation the resulting energy and velocity distributions of the sputtered excited and/or ionized secondary particles are calculated. These distributions are found to be a function of the emission angle depending on the model assumed for the initial excitation. From this formalism the total excited secondary particle yield may be calculated

A radiochemical technique for the establishment of a solvent-independent scale of ion activities in amphiprotic solvents

International Nuclear Information System (INIS)

Kim, J.I.; Duschner, H.; Born, H.J.

1975-01-01

The radiochemical determination of solubilities of hardly soluble compounds of silver (Ph 4 BAg, AgCl), by means of Ag-110m in amphiprotic solutions is used for setting-up a solvent-independent scale of ion activities based on the concept of the media effect. The media effects of the salts are calculated from the solubility data of the Ag compounds in question. The splitting into the media effects of single ions takes place with the extrathermodynamic assumption of the same media effects for large ions, such as Ph 4 B - = Ph 4 As - . A standardized ion activity scale in connection with the activity coefficients for the solvent in question can be established with water as the basic state of the chemical potential. As the sum of the media effects of the single ions gives the media effect of the salt concerned, which is easily obtained from data which are experimentally accessible (solubility, vapour pressure, ion exchange ect.), this method leads to single ion activities of a large number of ions in a multitude of solvents. (orig./LH) [de

Development of the simulation package 'ELSES' for extra-large-scale electronic structure calculation

International Nuclear Information System (INIS)

Hoshi, T; Fujiwara, T

2009-01-01

An early-stage version of the simulation package 'ELSES' (extra-large-scale electronic structure calculation) is developed for simulating the electronic structure and dynamics of large systems, particularly nanometer-scale and ten-nanometer-scale systems (see www.elses.jp). Input and output files are written in the extensible markup language (XML) style for general users. Related pre-/post-simulation tools are also available. A practical workflow and an example are described. A test calculation for the GaAs bulk system is shown, to demonstrate that the present code can handle systems with more than one atom species. Several future aspects are also discussed.

Brominated Tyrosine and Polyelectrolyte Multilayer Analysis by Laser Desorption VUV Postionization and Secondary Ion Mass Spectrometry

Energy Technology Data Exchange (ETDEWEB)

University of Illinois at Chicago; Blaze, Melvin M. T.; Takahashi, Lynelle; Zhou, Jia; Ahmed, Musahid; Gasper, Gerald; Pleticha, F. Douglas; Hanley, Luke

2011-03-14

The small molecular analyte 3,5-dibromotyrosine (Br2Y) and chitosan-alginate polyelectrolyte multilayers (PEM) with and without adsorbed Br2Y were analyzed by laser desorption postionization mass spectrometry (LDPI-MS). LDPI-MS using 7.87 eV laser and tunable 8 ? 12.5 eV synchrotron vacuum ultraviolet (VUV) radiation found that desorption of clusters from Br2Y films allowed detection by≤8 eV single photon ionization. Thermal desorption and electronic structure calculations determined the ionization energy of Br2Y to be ~;;8.3?0.1 eV and further indicated that the lower ionization energies of clusters permitted their detection at≤8 eV photon energies. However, single photon ionization could only detect Br2Y adsorbed within PEMs when using either higher photon energies or matrix addition to the sample. All samples were also analyzed by 25 keV Bi3 + secondary ion mass spectrometry (SIMS), with the negative ion spectra showing strong parent ion signal which complemented that observed by LDPI-MS. The negative ion SIMS depended strongly on the high electron affinity of this specific analyte and the analyte?s condensed phase environment.

Inexpensive read-out for coincident electron spectroscopy with a transmission electron microscope at nanometer scale using micro channel plates and multistrip anodes

International Nuclear Information System (INIS)

Hollander, R.W.; Bom, V.R.; Van Eijk, C.W.E.; Faber, J.S.; Hoevers, H.; Kruit, P.

1994-01-01

The elemental composition of a sample at nanometer scale is determined by measurement of the characteristic energy of Auger electrons, emitted in coincidence with incoming primary electrons from a microbeam in a scanning transmission electron microscope (STEM). Single electrons are detected with position sensitive detectors, consisting of MicroChannel Plates (MCP) and MultiStrip Anodes (MSA), one for the energy of the Auger electrons (Auger-detector) and one for the energy loss of primary electrons (EELS-detector). The MSAs are sensed with LeCroy 2735DC preamplifiers. The fast readout is based on LeCroy's PCOS III system. On the detection of a coincidence (Event) energy data of Auger and EELS are combined with timing data to an Event word. Event words are stored in list mode in a VME memory module. Blocks of Event words are scanned by transputers in VME and two-dimensional energy histograms are filled using the timing information to obtain a maximal true/accidental ratio. The resulting histograms are stored on disk of a PC-386, which also controls data taking. The system is designed to handle 10 5 Events per second, 90% of which are accidental. In the histograms the ''true'' to ''accidental'' ratio will be 5. The dead time is 15%. ((orig.))

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Science.gov (United States)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-01

Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An ;equivalent work function; is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called ;work function; (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Coherent structures at ion scales in fast and slow solar wind: Cluster observations

Science.gov (United States)

Perrone, D.; Alexandrova, O.; Zouganelis, Y.; Roberts, O.; Lion, S.; Escoubet, C. P.; Walsh, A. P.; Maksimovic, M.; Lacombe, C.

2017-12-01

Spacecraft measurements generally reveal that solar wind electromagnetic fluctuations are in a state of fully-developed turbulence. Turbulence represents a very complex problem in plasmas since cross-scale coupling and kinetic effects are present. Moreover, the intermittency phenomenon, i.e. the manifestation of the non-uniform and inhomogeneous energy transfer and dissipation in a turbulent system, represents a very important aspect of the solar wind turbulent cascade. Here, we study coherent structures responsible for solar wind intermittency around ion characteristic scales. We find that, in fast solar wind, intermittency is due to Alfvén vortex-like structures and current sheets. In slow solar wind, we observe as well compressive structures like magnetic solitons, holes and shocks. By using high-time resolution magnetic field data of multi-point measurements of Cluster spacecraft, we characterize the observed coherent structures in terms of topology and propagation speed. We show that all structures around ion characteristic scales, both in fast and slow solar wind, are characterized by a strong wave-vector anisotropy in the perpendicular direction with respect to the local magnetic field. Moreover, some of them propagate in the plasma rest frame in the direction perpendicular to the local field. Finally, a further analysis on the electron and ion velocity distributions shows a high variability; in particular, close to coherent structures the electron and ion distribution functions appear strongly deformed and far from the thermodynamic equilibrium. Possible interpretations of the observed structures and their role in the heating process of the plasma are also discussed.

Microscopic studies of RIB target materials and ion induced nanostructures

International Nuclear Information System (INIS)

Karmakar, Prasanta; Bhattacharya, Shampa; Roy, Tapatee Kundu; Bhowmick, Debasis; Chakrabarti, Alok

2010-01-01

The invention of electron microscope and scanning probe microscope has empowered us to visualize the tiny world that has explored many fundamental laws of natures. Further technological advancements have made these tools capable to probe micron size structures to individual atom. These microscopes are used to image and study micron size fibers or grain structures used for high yield radioactive products, to few nanometer size ripple, dot and hole structures produced by ion irradiation. Electron Microscope has also been used to characterize the ion beam synthesized dilute magnetic systems

Ion emission microscope microanalyzer

International Nuclear Information System (INIS)

Cherepin, V.T.; Olckovsky, V.L.

1977-01-01

In the ion microanalyzer (microprobe) the object is exposed to the bombardment of a highly focused ion beam, the secondary ions emitted from the object being analyzed by means of a mass filter. In order to be able to control the position of an analysis synchronous to the local analysis of an object an ion-optical converter (electron image with a fluorescent screen) is placed behind the aperture diaphragm in the direction of the secondary ion beam. The converter allows to make visible in front of the mass filter a non-split ion image characterizing the surface of the surface investigated. Then a certain section may be selected for performing chemical and isotope analyses. (DG) [de

Swift heavy ion irradiation of Cu-Zn-Al and Cu-Al-Ni alloys.

Science.gov (United States)

Zelaya, E; Tolley, A; Condo, A M; Schumacher, G

2009-05-06

The effects produced by swift heavy ions in the martensitic (18R) and austenitic phase (β) of Cu based shape memory alloys were characterized. Single crystal samples with a surface normal close to [210](18R) and [001](β) were irradiated with 200 MeV of Kr(15+), 230 MeV of Xe(15+), 350 and 600 MeV of Au(26+) and Au(29+). Changes in the microstructure were studied with transmission electron microscopy (TEM) and high resolution transmission electron microscopy (HRTEM). It was found that swift heavy ion irradiation induced nanometer sized defects in the 18R martensitic phase. In contrast, a hexagonal close-packed phase formed on the irradiated surface of β phase samples. HRTEM images of the nanometer sized defects observed in the 18R martensitic phase were compared with computer simulated images in order to interpret the origin of the observed contrast. The best agreement was obtained when the defects were assumed to consist of local composition modulations.

Fiscal 2000 achievement report on the research and development of nanometer controlled optical disk system; 2000 nendo nanometer seigyo hikari disk system no kenkyu kaihatsu seika hokokusho

Energy Technology Data Exchange (ETDEWEB)

NONE

2001-03-01

Development proceeded of nanometer controlled optical memory technologies as part of systematic research and development aiming at the reinforcement of industrial technology power in the field of data recording. Activities were conducted in the four fields of (1) high density signal processing technology, (2) high performance disk materials technology, (3) disk substrate fabrication technology, and (4) signal detection technology. Discussed in field (1) were multivalue ROM (read only memory) disk signal regeneration, SIL-LBR (solid immersion lens-laser beam recorder), dry etching process using RIE (reactive ion etching), SHG (second harmonic generation) blue laser, and a multivalue ROM disk evaluation system. Studied in field (2) were the evaluation of ROM disk performance dependent on recording materials, development of high density recording materials, and the evaluation of crystallization induction time using a static tester. Studied in the development of high density recording materials was the formation of microscopic recording marks in a phase shift/surface recording type disk comprising a 4-element (Ag-In-Sb-Te) recording layer and an Ag reflection layer. In fiscal 2000, an attempt was made at the 0.07 {mu}m level. (NEDO)

Thin, Flexible Secondary Li-Ion Paper Batteries

KAUST Repository

Hu, Liangbing; Wu, Hui; La Mantia, Fabio; Yang, Yuan; Cui, Yi

2010-01-01

, flexible Li-ion batteries using paper as separators and free-standing carbon nanotube thin films as both current collectors. The current collectors and Li-ion battery materials are integrated onto a single sheet of paper through a lamination process

Progress in heavy ion fusion research

International Nuclear Information System (INIS)

Celata, C.M.; Bieniosek, F.M.; Henestroza, E.; Kwan, J.W.; Lee, E.P.; Logan, G.; Prost, L.; Seidl, P.A.; Vay, J.-L.; Waldron, W.L.; Yu, S.S.; Barnard, J.J.; Callahan, D.A.; Cohen, R.H.; Friedman, A.; Grote, D.P.; Lund, S.M.; Molvik, A.; Sharp, W.M.; Westenskow, G.

2003-01-01

The U.S. Heavy Ion Fusion program has recently commissioned several new experiments. In the High Current Experiment [P. A. Seidl et al., Laser Part. Beams 20, 435 (2003)], a single low-energy beam with driver-scale charge-per-unit-length and space-charge potential is being used to study the limits to transportable current posed by nonlinear fields and secondary atoms, ions, and electrons. The Neutralized Transport Experiment similarly employs a low-energy beam with driver-scale perveance to study final focus of high perveance beams and neutralization for transport in the target chamber. Other scaled experiments--the University of Maryland Electron Ring [P. G. O'Shea et al., accepted for publication in Laser Part. Beams] and the Paul Trap Simulator Experiment [R. C. Davidson, H. Qin, and G. Shvets, Phys. Plasmas 7, 1020 (2000)]--will provide fundamental physics results on processes with longer scale lengths. An experiment to test a new injector concept is also in the design stage. This paper will describe the goals and status of these experiments, as well as progress in theory and simulation. A proposed future proof-of-principle experiment, the Integrated Beam Experiment, will also be described

Electromagnetic fields of Nanometer electromagnetic waves and X-ray. New frontiers of electromagnetic wave engineering

International Nuclear Information System (INIS)

2009-01-01

The investigating committee aimed at research on electromagnetic fields in functional devices and X-ray fibers for efficient coherent X-ray generation and their material science, high-precision manufacturing, X-ray microscope, application to medical and information communication technologies, such as interaction between material and nanometer electromagnetic waves of radiated light and X-ray, interaction between microwaves and particle beams, theory and design of high-frequency waveguides for resonator and accelerator, from January 2003 to December 2005. In this report, we describe our research results, in particular, on the topics of synchrotron radiation and Cherenkov radiation, Kyushu synchrotron light source and its technology, nanometer electromagnetic fields in optical region, process of interaction between evanescent waves and near-field light, orthogonal relation of electromagnetic fields including evanescent waves in dispersive dielectrics, optical amplification using electron beam, nanometer electromagnetic fields in focusing waveguide lens device with curved facets, electromagnetic fields in nanometer photonic crystal waveguide consisting of atoms, X-ray scattering and absorption I bio-material for image diagnosis. (author)

Studies on the determination of surface deuterium in AISI 1062, 4037, and 4140 steels by secondary ion mass spectrometry

Science.gov (United States)

Sastri, V. S.; Donepudi, V. S.; McIntyre, N. S.; Johnston, D.; Revie, R. W.

1988-12-01

The concentration of deuterium at the surface of cathodically charged high strength steels AISI 1062, 4037, and 4140 has been determined by secondary ion mass spectrometry (SIMS). The beneficial effects of pickling in NAP (a mixture of nitric, acetic, and phosphoric acids) to remove surfacebound deuterium have been observed.

Experimental study on the secondary emission (atomic and molecular ions, aggregates, electrons) induced by the bombardment of surfaces by means of energetic heavy ions (∼ MeV/u). Effects of the charge state of the projectiles

International Nuclear Information System (INIS)

Monart, B.

1988-05-01

The ionic and electronic emissions, induced by the sputtering of solid targets (organic and inorganic) with 1 MeV/u projectiles. The time-of-flight spectrometry is applied to the secondary emission analysis. The projectile velocity, the angle of attack (between the beam and the target), and the projectile's incident charge state, are taken into account. It is shown that the secondary emission depends on the charge of the incident ion and on the charge state changement in the material's bulk. A model, applying the theoretical calculations concerning the charge in the material's bulk, is proposed. The existence of an interaction depth, for the incident ion and the material, which depends on the secondary ions type and on the incident ion charge, is suggested. The calculated depth is about 200 angstroms for the aggregates ejected from a CsI target, sputtered with 14 Kr 18+ . The H + yield (coming from ∼ 10 angstroms) is used as a projectile charge probe, at the material surface. The experimental method allows, for the first time, the obtention of the equilibrium charge state in the condensed matter. The same method is applied to determine the non-equilibrium charges in the bulk of thin materials. The results show that, after leaving the material, the projectile presents a post-ionization state [fr

Obtaining of iron particles of nanometer size in a natural zeolite

International Nuclear Information System (INIS)

Xingu C, E. G.

2013-01-01

The zeolites are aluminosilicates with cavities that can act as molecular sieve. Their crystalline structure is formed by tetrahedrons that get together giving place to a three-dimensional net, in which each oxygen is shared by two silicon atoms, being this way part of the tecto silicate minerals, its external and internal areas reach the hundred square meters for gram, they are located in a natural way in a large part of earth crust and also exist in a synthetic way. In Mexico there are different locations of zeolitic material whose important component is the clinoptilolite. In this work the results of three zeolitic materials coming from San Luis Potosi are shown, the samples were milled and sieved for its initial characterization, to know its chemical composition, crystalline phases, morphology, topology and thermal behavior before and after its homo-ionization with sodium chloride, its use as support of iron particles of nanometer size. The description of the synthesis of iron particles of nanometer size is also presented, as well as the comparison with the particles of nanometer size synthesized without support after its characterization. The characterization techniques used during the experimental work were: Scanning electron microscopy, X-ray diffraction, Infrared spectroscopy, specific area by means of BET and thermogravimetry analysis. (Author)

Dynamic Secondary Ion Mass Spectrometry | Materials Science | NREL

Science.gov (United States)

Ion Mass Spectrometry (SIMS) uses a continuous, focused beam of primary ions to remove material from the surface of a sample by sputtering. The fraction of sputtered material that is ionized is extracted Identifies all elements or isotopes present in a material, from hydrogen to uranium. Different primary-ion

Some general scaling rules in high energy heavy ion reactions

International Nuclear Information System (INIS)

Andersson, B.; Idh, J.; Otterlund, I.; Stenlund, E.

1988-09-01

We show, using the Fritiof model scenario that the wide variation in the number of participating nucleons tend to drown other dynamical variations in the measurables of high energy ion collisions. We propose a set if general scaling laws for inclusive distributions in which it is the mean multiplicity and the mean transverse energy from each source which are the measurables in the interactions. (authors)

Sodium-ion supercapacitors based on nanoporous pyroproteins containing redox-active heteroatoms

Science.gov (United States)

Cho, Se Youn; Yoon, Hyeon Ji; Kim, Na Rae; Yun, Young Soo; Jin, Hyoung-Joon

2016-10-01

Nanostructured carbon-based materials fabricated via simple methods from renewable bio-resources have great potential in rechargeable energy storage systems. In this study, nanoporous pyroproteins containing a large amount of redox-active heteroatoms (H-NPs) were fabricated from silk fibroin by an in situ carbonization/activation method. The H-NPs have a large surface area of ∼3050 m2 g-1, which is mainly comprised of nanometer-scale pores. Also, these H-NPs have oxygen and nitrogen heteroatoms of 17.4 wt% and 2.9 wt%, respectively. Synergistic sodium ion storage behaviors originate from electrochemical double layer capacitance and pseudocapacitance, leading to very high electrochemical performances of H-NPs in aqueous and non-aqueous electrolyte systems. Sodium-ion supercapacitors (NISs) based on commercial graphite//H-NPs show a high specific power of ∼1900 W kg-1 at ∼77 Wh kg-1. Also, NISs based on commercial hard carbon//H-NPs exhibit a high specific energy of ∼217 Wh kg-1 at ∼42 W kg-1. In addition, outstanding cycling performances over 30,000 cycles are achieved for symmetric NISs.

Nanostructuring by ion beam

International Nuclear Information System (INIS)

Valbusa, U.; Boragno, C.; Buatier de Mongeot, F.

2003-01-01

In metals, the surface curvature dependence of the sputtering yield and the presence of an extra energy barrier whenever diffusing adatoms try to descend step edges, produce a similar surface instability, which builds up regular patterns. By tuning the competition between these two mechanisms, it is possible to create self-organized structures of the size of few nanometers. Height, lateral distance and order of the structures change with the deposition parameters like ion energy, dose, incident angle and substrate temperature. The paper offers an overview of the experiments carried out and foresees possible applications of these results in the area of material science

Long-term irradiation effects on reactor-pressure vessel steels. Investigations on the nanometer scale

Energy Technology Data Exchange (ETDEWEB)

Wagner, Arne

2017-06-01

The exposure of reactor pressure vessel (RPV) steels to neutron irradiation gives rise to irradiation-enhanced diffusion, a rearrangement of solute atoms and, consequently, a degradation of the mechanical properties. The increasing age of existing nuclear power plants raises new questions specific to long-term operation. Two of them are addressed in this thesis: flux effects and the late-blooming effect. Can low-flux irradiations up to a given fluence be reproduced by more rapid high-flux irradiations up to the same fluence? Can the irradiation response of RPV steels be extrapolated to higher fluences or are there unexpected ''late-blooming'' effects. Small-angle neutron scattering (SANS), atom-probe tomography (APT) and Vickers-hardness testing were applied. A novel Monte-Carlo based fitting algorithm for SANS data was implemented in order to derive statistically reliable characteristics of irradiation-induced solute-atom clusters. APT was applied in selected cases to gain additional information on the composition and the shape of clusters. Vickers hardness testing was performed on the SANS samples to link the nanometer-scale changes to irradiation hardening. The investigations on flux effects show that clusters forming upon high-flux irradiation are smaller and tend to have a higher number density compared to low-flux irradiations at a given neutron fluence. The measured flux dependence of the cluster-size distribution is consistent with the framework of deterministic growth (but not with coarsening) in combination with radiation-enhanced diffusion. Since the two effects on cluster-size and volume fraction partly cancel each other out, no significant effect on the hardening is observed. The investigations of a possible late-blooming effect indicate that the very existence (yes or no) of such an effect depends on the irradiation conditions. Irradiations at lower fluxes and a lower temperature (255 C) give rise to a significant increase of the

Nanometer and molecular materials: the greatness of the very tiny; Materiales manometricos y moleculares: la grandeza de lo infimo

Energy Technology Data Exchange (ETDEWEB)

Rincon, Marina [Centro de Investigacion en Energia (CIE) de la UNAM, Temixco, Morelos (Mexico)

2010-07-01

Some of the materials have been present in our lives for many years, and now appear with unique or improved properties by the fact that they can be manufactured in the nanometer scale; that is, a million times smaller than a millimeter and with geometries that include the nanodots, the nanotubes, the nanowires, to mention a few of them. The most popular is the titanium dioxide (Titania), known by many as the white pigment in paints, sunscreens, cosmetics and others for their null toxicity, low cost and high stability. Strictly speaking, these features are really applicable to the micrometric material (which is a thousand times larger than the nanometer) and it is still to be proven toxicity and stability of the nanometer materials; but it is a fact that the nanometer titania is very popular in a multitude of applications that have to do with catalysis, sensors, and energy conversion and storing. We will also deal with conductive polymers, which are molecular conjugated materials. [Spanish] Algunos de los materiales han estado presentes en nuestras vidas por muchos anos y ahora aparecen con propiedades unicas o mejoradas por el hecho de que se pueden fabricar en la escala de los nanometros; esto es, un millon de veces mas pequenos que un milimetro y con geometrias que comprenden los nanopuntos, los nanotubos, los nanoalambres, por mencionar algunas. El mas popular es el dioxido de titanio (titania), conocido por muchos como el pigmento blanco de las pinturas, filtros solares, cosmeticos y demas, por su nula toxicidad, bajo costo y gran estabilidad. Estrictamente hablando, estas caracteristicas son realmente aplicables al material micrometrico (que es mil veces mas grande que el nanometrico) y todavia esta por probarse la toxicidad y estabilidad de los nanomateriales; pero es un hecho que la titania nanometrica es muy popular en un sinfin de aplicaciones que tienen que ver con catalisis, sensores, y conversion y almacenamiento de energia. Hablaremos tambien de

Sample processing, protocol, and statistical analysis of the time-of-flight secondary ion mass spectrometry (ToF-SIMS) of protein, cell, and tissue samples.

Science.gov (United States)

Barreto, Goncalo; Soininen, Antti; Sillat, Tarvo; Konttinen, Yrjö T; Kaivosoja, Emilia

2014-01-01

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is increasingly being used in analysis of biological samples. For example, it has been applied to distinguish healthy and osteoarthritic human cartilage. This chapter discusses ToF-SIMS principle and instrumentation including the three modes of analysis in ToF-SIMS. ToF-SIMS sets certain requirements for the samples to be analyzed; for example, the samples have to be vacuum compatible. Accordingly, sample processing steps for different biological samples, i.e., proteins, cells, frozen and paraffin-embedded tissues and extracellular matrix for the ToF-SIMS are presented. Multivariate analysis of the ToF-SIMS data and the necessary data preprocessing steps (peak selection, data normalization, mean-centering, and scaling and transformation) are discussed in this chapter.

A Virtual Research Environment for a Secondary Ion Mass Spectrometer (SIMS)

Science.gov (United States)

Wiedenbeck, M.; Schäfer, L.; Klump, J.; Galkin, A.

2013-12-01

Overview: This poster describes the development of a Virtual Research Environment for the Secondary Ion Mass Spectrometer (SIMS) at GFZ Potsdam. Background: Secondary Ion Mass Spectrometers (SIMS) are extremely sensitive instruments for analyzing the surfaces of solid and thin film samples. These instruments are rare, expensive and experienced operators are very highly sought after. As such, measurement time is a precious commodity, until now only accessible to small numbers of researchers. The challenge: The Virtual SIMS Project aims to set up a Virtual Research Environment for the operation of the CAMECA IMS 1280-HR instrument at the GFZ Potsdam. The objective of the VRE is to provide SIMS access not only to researchers locally present in Potsdam but also to scientists working with SIMS cooperation partners in e.g., South Africa, Brazil or India. The requirements: The system should address the complete spectrum of laboratory procedures - from online application for measurement time, to remote access for data acquisition to data archiving for the subsequent publication and for future reuse. The approach: The targeted Virtual SIMS Environment will consist of a: 1. Web Server running the Virtual SIMS website providing general information about the project, lab access proposal forms and calendar for the timing of project related tasks. 2. LIMS Server, responsible for scheduling procedures, data management and, if applicable, accounting and billing. 3. Remote SIMS Tool, devoted to the operation of the experiment within a remote control environment. 4. Publishing System, which supports the publication of results in cooperation with the GFZ Library services. 5. Training Simulator, which offers the opportunity to rehearse experiments and to prepare for possible events such as a power outages or interruptions to broadband services. First results: The SIMS Virtual Research Environment will be mainly based on open source software, the only exception being the CAMECA IMS

The neon gas field ion source-a first characterization of neon nanomachining properties

International Nuclear Information System (INIS)

Livengood, Richard H.; Tan, Shida; Hallstein, Roy; Notte, John; McVey, Shawn; Faridur Rahman, F.H.M.

2011-01-01

At the Charged Particle Optics Conference (CPO7) in 2006, a novel trimer based helium gas field ion source (GFIS) was introduced for use in a new helium ion microscope (HIM), demonstrating the novel source performance attributes and unique imaging applications of the HIM (Hill et al., 2008 ; Livengood et al., 2008 ). Since that time there have been numerous enhancements to the HIM source and platform demonstrating resolution scaling into the sub 0.5 nm regime (Scipioni et al., 2009 ; Pickard et al., 2010 ). At this Charged Particle Optics Conference (CPO8) we will be introducing a neon version of the trimer-GFIS co-developed by Carl Zeiss SMT and Intel Corporation. The neon source was developed as a possible supplement to the gallium liquid metal ion source (LMIS) used today in most focused ion beam (FIB) systems (Abramo et al., 1994 ; Young et al.,1998 ). The neon GFIS source has low energy spread (∼1 eV) and a small virtual source size (sub-nanometer), similar to that of the helium GFIS. However neon does differ from the helium GFIS in two significant ways: neon ions have high sputtering yields (e.g. 1 Si atom per incident ion at 20 keV); and have relatively shallow implant depth (e.g. 46 nm in silicon at 20 keV). Both of these are limiting factors for helium in many nanomachining applications. In this paper we will present both simulation and experimental results of the neon GFIS used for imaging and nanomachining applications.

X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of aging effects on the mineral fibers treated with aminopropylsilane and quaternary ammonium compounds

DEFF Research Database (Denmark)

Zafar, Ashar; Schjødt-Thomsen, Jan; Sodhi, R.

2012-01-01

(PCA) was applied to the time-of-flight secondary ion mass spectrometry spectra, and an increase in the intensities of APS characteristic peaks were observed after aging. The observed increase in the signals of APS originates from underlying silanized fibers after the removal of the surfactant......X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry were used to investigate the aging effects on the aminopropylsilane (APS) and quaternary ammonium surfactant-treated mineral fibers. APS-coated mineral fiber samples were treated with cationic surfactant...

Ion Transport and Structure in Polymer Electrolytes with Applications in Lithium Batteries

Science.gov (United States)

Chintapalli, Mahati

When mixed with lithium salts, polymers that contain more than one chemical group, such as block copolymers and endgroup-functionalized polymers, are promising electrolyte materials for next-generation lithium batteries. One chemical group can provide good ion solvation and transport properties, while the other chemical group can provide secondary properties that improve the performance characteristics of the battery. Secondary properties of interest include non-flammability for safer lithium ion batteries and high mechanical modulus for dendrite resistance in high energy density lithium metal batteries. Block copolymers and other materials with multiple chemical groups tend to exhibit nanoscale heterogeneity and can undergo microphase separation, which impacts the ion transport properties. In block copolymers that microphase separate, ordered self-assembled structures occur on longer length scales. Understanding the interplay between structure at different length scales, salt concentration, and ion transport is important for improving the performance of multifunctional polymer electrolytes. In this dissertation, two electrolyte materials are characterized: mixtures of endgroup-functionalized, short chain perfluoropolyethers (PFPEs) and lithium bis(trifluoromethanesulfonyl) imide (LiTFSI) salt, and mixtures of polystyrene-block-poly(ethylene oxide) (PS- b-PEO; SEO) and LiTFSI. The PFPE/LiTFSI electrolytes are liquids in which the PFPE backbone provides non-flammability, and the endgroups resemble small molecules that solvate ions. In these electrolytes, the ion transport properties and nanoscale heterogeneity (length scale 1 nm) are characterized as a function of endgroup using electrochemical techniques, nuclear magnetic resonance spectroscopy, and wide angle X-ray scattering. Endgroups, especially those containing PEO segments, have a large impact on ionic conductivity, in part because the salt distribution is not homogenous; we find that salt partitions

The Synergistic Effect of Leukocyte Platelet-Rich Fibrin and Micrometer/Nanometer Surface Texturing on Bone Healing around Immediately Placed Implants: An Experimental Study in Dogs

Science.gov (United States)

Neiva, Rodrigo F.; Gil, Luiz Fernando; Tovar, Nick; Janal, Malvin N.; Marao, Heloisa Fonseca; Pinto, Nelson; Coelho, Paulo G.

2016-01-01

Aims. This study evaluated the effects of L-PRF presence and implant surface texture on bone healing around immediately placed implants. Methods. The first mandibular molars of 8 beagle dogs were bilaterally extracted, and implants (Blossom™, Intra-Lock International, Boca Raton, FL) were placed in the mesial or distal extraction sockets in an interpolated fashion per animal. Two implant surfaces were distributed per sockets: (1) dual acid-etched (DAE, micrometer scale textured) and (2) micrometer/nanometer scale textured (Ossean™ surface). L-PRF (Intraspin system, Intra-Lock International) was placed in a split-mouth design to fill the macrogap between implant and socket walls on one side of the mandible. The contralateral side received implants without L-PRF. A mixed-model ANOVA (at α = 0.05) evaluated the effect of implant surface, presence of L-PRF, and socket position (mesial or distal), individually or in combination on bone area fraction occupancy (BAFO). Results. BAFO values were significantly higher for the Ossean relative to the DAE surface on the larger mesial socket. The presence of L-PRF resulted in higher BAFO. The Ossean surface and L-PRF presence resulted in significantly higher BAFO. Conclusion. L-PRF and the micro-/nanometer scale textured surface resulted in increased bone formation around immediately placed implants. PMID:28042577

The Synergistic Effect of Leukocyte Platelet-Rich Fibrin and Micrometer/Nanometer Surface Texturing on Bone Healing around Immediately Placed Implants: An Experimental Study in Dogs

Directory of Open Access Journals (Sweden)

Rodrigo F. Neiva

2016-01-01

Full Text Available Aims. This study evaluated the effects of L-PRF presence and implant surface texture on bone healing around immediately placed implants. Methods. The first mandibular molars of 8 beagle dogs were bilaterally extracted, and implants (Blossom™, Intra-Lock International, Boca Raton, FL were placed in the mesial or distal extraction sockets in an interpolated fashion per animal. Two implant surfaces were distributed per sockets: (1 dual acid-etched (DAE, micrometer scale textured and (2 micrometer/nanometer scale textured (Ossean™ surface. L-PRF (Intraspin system, Intra-Lock International was placed in a split-mouth design to fill the macrogap between implant and socket walls on one side of the mandible. The contralateral side received implants without L-PRF. A mixed-model ANOVA (at α=0.05 evaluated the effect of implant surface, presence of L-PRF, and socket position (mesial or distal, individually or in combination on bone area fraction occupancy (BAFO. Results. BAFO values were significantly higher for the Ossean relative to the DAE surface on the larger mesial socket. The presence of L-PRF resulted in higher BAFO. The Ossean surface and L-PRF presence resulted in significantly higher BAFO. Conclusion. L-PRF and the micro-/nanometer scale textured surface resulted in increased bone formation around immediately placed implants.

Multiscale approach to the physics of radiation damage with ions

International Nuclear Information System (INIS)

Surdutovich, E.; Solov'yov, A.

2014-01-01

The multiscale approach to the assessment of bio-damage resulting upon irradiation of biological media with ions is reviewed, explained and compared to other approaches. The processes of ion propagation in the medium concurrent with ionization and excitation of molecules, transport of secondary products, dynamics of the medium, and biological damage take place on a number of different temporal, spatial and energy scales. The multiscale approach, a physical phenomenon-based analysis of the scenario that leads to radiation damage, has been designed to consider all relevant effects on a variety of scales and develop an approach to the quantitative assessment of biological damage as a result of irradiation with ions. Presently, physical and chemical effects are included in the scenario while the biological effects such as DNA repair are only mentioned. This paper explains the scenario of radiation damage with ions, overviews its major parts, and applies the multiscale approach to different experimental conditions. On the basis of this experience, the recipe for application of the multiscale approach is formulated. The recipe leads to the calculation of relative biological effectiveness. (authors)

Accelerator-based single-shot ultrafast transmission electron microscope with picosecond temporal resolution and nanometer spatial resolution

Science.gov (United States)

Xiang, D.; Fu, F.; Zhang, J.; Huang, X.; Wang, L.; Wang, X.; Wan, W.

2014-09-01

We present feasibility study of an accelerator-based ultrafast transmission electron microscope (u-TEM) capable of producing a full field image in a single-shot with simultaneous picosecond temporal resolution and nanometer spatial resolution. We study key physics related to performance of u-TEMs and discuss major challenges as well as possible solutions for practical realization of u-TEMs. The feasibility of u-TEMs is confirmed through simulations using realistic electron beam parameters. We anticipate that u-TEMs with a product of temporal and spatial resolution beyond 10-19 ms will open up new opportunities in probing matter at ultrafast temporal and ultrasmall spatial scales.

Imaging Action Potential in Single Mammalian Neurons by Tracking the Accompanying Sub-Nanometer Mechanical Motion.

Science.gov (United States)

Yang, Yunze; Liu, Xian-Wei; Wang, Hui; Yu, Hui; Guan, Yan; Wang, Shaopeng; Tao, Nongjian

2018-03-28

Action potentials in neurons have been studied traditionally by intracellular electrophysiological recordings and more recently by the fluorescence detection methods. Here we describe a label-free optical imaging method that can measure mechanical motion in single cells with a sub-nanometer detection limit. Using the method, we have observed sub-nanometer mechanical motion accompanying the action potential in single mammalian neurons by averaging the repeated action potential spikes. The shape and width of the transient displacement are similar to those of the electrically recorded action potential, but the amplitude varies from neuron to neuron, and from one region of a neuron to another, ranging from 0.2-0.4 nm. The work indicates that action potentials may be studied noninvasively in single mammalian neurons by label-free imaging of the accompanying sub-nanometer mechanical motion.

Evolution of atomic-scale surface structures during ion bombardment: A fractal simulation

International Nuclear Information System (INIS)

Shaheen, M.A.; Ruzic, D.N.

1993-01-01

Surfaces of interest in microelectronics have been shown to exhibit fractal topographies on the atomic scale. A model utilizing self-similar fractals to simulate surface roughness has been added to the ion bombardment code TRIM. The model has successfully predicted experimental sputtering yields of low energy (less then 1000 eV) Ar on Si and D on C using experimentally determined fractal dimensions. Under ion bombardment the fractal surface structures evolve as the atoms in the collision cascade are displaced or sputtered. These atoms have been tracked and the evolution of the surface in steps of one monolayer of flux has been determined. The Ar--Si system has been studied for incidence energies of 100 and 500 eV, and incidence angles of 0 degree, 30 degree, and 60 degree. As expected, normally incident ion bombardment tends to reduce the roughness of the surface, whereas large angle ion bombardment increases the degree of surface roughness. Of particular interest though, the surfaces are still locally self-similar fractals after ion bombardment and a steady state fractal dimension is reached, except at large angles of incidence

Elastic properties of sub-stoichiometric nitrogen ion implanted silicon

Energy Technology Data Exchange (ETDEWEB)

Sarmanova, M.F., E-mail: marina.sarmanova@iom-leipzig.de [Leibniz Institute of Surface Modification, D-04318 Leipzig (Germany); Karl, H. [University Augsburg, Institute of Physics, D-86135 Augsburg (Germany); Mändl, S.; Hirsch, D. [Leibniz Institute of Surface Modification, D-04318 Leipzig (Germany); Mayr, S.G.; Rauschenbach, B. [Leibniz Institute of Surface Modification, D-04318 Leipzig (Germany); University Leipzig, Institute for Experimental Physics II, D-04103 Leipzig (Germany)

2015-04-15

Elastic properties of sub-stoichiometric nitrogen implanted silicon were measured with nanometer-resolution using contact resonance atomic force microscopy (CR-AFM) as function of ion fluence and post-annealing conditions. The determined range of indentation moduli was between 100 and 180 GPa depending on the annealing duration and nitrogen content. The high indentation moduli can be explained by formation of Si–N bonds, as verified by X-ray photoelectron spectroscopy.

Progress in heavy ion driven inertial fusion energy: From scaled experiments to the integrated research experiment

International Nuclear Information System (INIS)

Barnard, J.J.; Ahle, L.E.; Baca, D.; Bangerter, R.O.; Bieniosek, F.M.; Celata, C.M.; Chacon-Golcher, E.; Davidson, R.C.; Faltens, A.; Friedman, A.; Franks, R.M.; Grote, D.P.; Haber, I.; Henestroza, E.; Hoon, M.J.L. de; Kaganovich, I.; Karpenko, V.P.; Kishek, R.A.; Kwan, J.W.; Lee, E.P.; Logan, B.G.; Lund, S.M.; Meier, W.R.; Molvik, A.W.; Olson, C.; Prost, L.R.; Qin, H.; Rose, D.; Sabbi, G.-L.; Sangster, T.C.; Seidl, P.A.; Sharp, W.M.; Shuman, D.; Vay, J.-L.; Waldron, W.L.; Welch, D.; Yu, S.S.

2001-01-01

The promise of inertial fusion energy driven by heavy ion beams requires the development of accelerators that produce ion currents (∼100's Amperes/beam) and ion energies (∼1-10 GeV) that have not been achieved simultaneously in any existing accelerator. The high currents imply high generalized perveances, large tune depressions, and high space charge potentials of the beam center relative to the beam pipe. Many of the scientific issues associated with ion beams of high perveance and large tune depression have been addressed over the last two decades on scaled experiments at Lawrence Berkeley and Lawrence Livermore National Laboratories, the University of Maryland, and elsewhere. The additional requirement of high space charge potential (or equivalently high line charge density) gives rise to effects (particularly the role of electrons in beam transport) which must be understood before proceeding to a large scale accelerator. The first phase of a new series of experiments in Heavy Ion Fusion Virtual National Laboratory (HIF VNL), the High Current Experiments (HCX), is now being constructed at LBNL. The mission of the HCX will be to transport beams with driver line charge density so as to investigate the physics of this regime, including constraints on the maximum radial filling factor of the beam through the pipe. This factor is important for determining both cost and reliability of a driver scale accelerator. The HCX will provide data for design of the next steps in the sequence of experiments leading to an inertial fusion energy power plant. The focus of the program after the HCX will be on integration of all of the manipulations required for a driver. In the near term following HCX, an Integrated Beam Experiment (IBX) of the same general scale as the HCX is envisioned. The step which bridges the gap between the IBX and an engineering test facility for fusion has been designated the Integrated Research Experiment (IRE). The IRE (like the IBX) will provide an

Surface enhanced Raman scattering of gold nanoparticles supported on copper foil with graphene as a nanometer gap

International Nuclear Information System (INIS)

Xiang, Quan; Zhu, Xupeng; Chen, Yiqin; Duan, Huigao

2016-01-01

Gaps with single-nanometer dimensions (<10 nm) between metallic nanostructures enable giant local field enhancements for surface enhanced Raman scattering (SERS). Monolayer graphene is an ideal candidate to obtain a sub-nanometer gap between plasmonic nanostructures. In this work, we demonstrate a simple method to achieve a sub-nanometer gap by dewetting a gold film supported on monolayer graphene grown on copper foil. The Cu foil can serve as a low-loss plasmonically active metallic film that supports the imaginary charge oscillations, while the graphene can not only create a stable sub-nanometer gap for massive plasmonic field enhancements but also serve as a chemical enhancer. We obtained higher SERS enhancements in this graphene-gapped configuration compared to those in Au nanoparticles on Cu film or on graphene–SiO 2 –Si. Also, the Raman signals measured maintained their fine features and intensities over a long time period, indicating the stability of this Au–graphene–Cu hybrid configuration as an SERS substrate. (paper)

Design of zeolite ion-exchange columns for wastewater treatment

International Nuclear Information System (INIS)

Robinson, S.M.; Arnold, W.D.; Byers, C.H.

1991-01-01

Oak Ridge National Laboratory plans to use chabazite zeolites for decontamination of wastewater containing parts-per-billion levels of 90 Sr and 137 Cs. Treatability studies indicate that such zeolites can remove trace amounts of 90 Sr and 137 Cs from wastewater containing high concentrations of calcium and magnesium. These studies who that zeolite system efficiency is dependent on column design and operating conditions. Previous results with bench-scale, pilot-scale, and near-full-scale columns indicate that optimized design of full-scale columns could reduce the volume of spent solids generation by one-half. The data indicate that shortcut scale-up methods cannot be used to design columns to minimize secondary waste generation. Since the secondary waste generation rate is a primary influence on process cost effectiveness, a predictive mathematical model for column design is being developed. Equilibrium models and mass-transfer mechanisms are being experimentally determined for isothermal multicomponent ion exchange (Ca, Mg, Na, Cs, and Sr). Mathematical models of these data to determine the breakthrough curves for different column configurations and operating conditions will be used to optimize the final design of full-scale treatment plant. 32 refs., 6 figs., 3 tabs

Atomic imaging using secondary electrons in a scanning transmission electron microscope: experimental observations and possible mechanisms.

Science.gov (United States)

Inada, H; Su, D; Egerton, R F; Konno, M; Wu, L; Ciston, J; Wall, J; Zhu, Y

2011-06-01

We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. Copyright © 2010 Elsevier B.V. All rights reserved.

Ionic secondary emission SIMS principles and instrumentation

International Nuclear Information System (INIS)

Darque-Ceretti, E.; Migeon, H.N.; Aucouturier, M.

1998-01-01

The ionic analysis by secondary emission (SIMS) is one of material analysis based on the ions bombardment. That is micro-analysis method in taking into account that the dimensions of the analysed volume are under the micrometer. This paper details in a first part some ionic secondary emission principle to introduce a description of the instrumentation: microprobe, ions production, spectrometers. (A.L.B.)

Low-cost, high-precision micro-lensed optical fiber providing deep-micrometer to deep-nanometer-level light focusing.

Science.gov (United States)

Wen, Sy-Bor; Sundaram, Vijay M; McBride, Daniel; Yang, Yu

2016-04-15

A new type of micro-lensed optical fiber through stacking appropriate high-refractive microspheres at designed locations with respect to the cleaved end of an optical fiber is numerically and experimentally demonstrated. This new type of micro-lensed optical fiber can be precisely constructed with low cost and high speed. Deep micrometer-scale and submicrometer-scale far-field light spots can be achieved when the optical fibers are multimode and single mode, respectively. By placing an appropriate teardrop dielectric nanoscale scatterer at the far-field spot of this new type of micro-lensed optical fiber, a deep-nanometer near-field spot can also be generated with high intensity and minimum joule heating, which is valuable in high-speed, high-resolution, and high-power nanoscale detection compared with traditional near-field optical fibers containing a significant portion of metallic material.

Strain relaxation of CdTe on Ge studied by medium energy ion scattering

Energy Technology Data Exchange (ETDEWEB)

Pillet, J.C., E-mail: jean-christophe.pillet@cea.fr [Univ. Grenoble Alpes, CEA, LETI, MINATEC campus, F38000 Grenoble (France); CEA, LETI, Département Optique et Photonique, F38054 Grenoble (France); Pierre, F. [Univ. Grenoble Alpes, CEA, LETI, MINATEC campus, F38000 Grenoble (France); CEA, LETI, Service de Caractérisation des Matériaux et Composants, F38054 Grenoble (France); Jalabert, D. [Univ. Grenoble Alpes, CEA, LETI, MINATEC campus, F38000 Grenoble (France); CEA-INAC/UJF-Grenoble 1 UMR-E, SP2M, LEMMA, Minatec Grenoble F-38054 (France)

2016-10-01

We have used the medium energy ion scattering (MEIS) technique to assess the strain relaxation in molecular-beam epitaxial (MBE) grown CdTe (2 1 1)/Ge (2 1 1) system. A previous X-ray diffraction study, on 10 samples of the same heterostructure having thicknesses ranging from 25 nm to 10 μm has allowed the measurement of the strain relaxation on a large scale. However, the X-ray diffraction measurements cannot achieve a stress measurement in close proximity to the CdTe/Ge interface at the nanometer scale. Due to the huge lattice misfit between the CdTe and Ge, a high degree of disorder is expected at the interface. The MEIS in channeling mode is a good alternative in order to profile defects with a high depth resolution. For a 21 nm thick CdTe layer, we observed, at the interface, a high density of Cd and/or Te atoms moved from their expected crystallographic positions followed by a rapid recombination of defects. Strain relaxation mechanisms in the vicinity of the interface are discussed.

Secondary partitioning isotope effects on solvolytic ion pair intermediates

International Nuclear Information System (INIS)

Abbey, K.J.

1976-01-01

The thermal decomposition of N-benzhydryl N-nitrosobenzamide (BNB) has been shown to produce an ion pair which either forms ester or reacts with the solvent. In ethanol, the fraction of ester produced, R, was much smaller than R values obtained from solvolysis or from the diphenyldiazomethane (DDM)-benzoic acid reaction, which was suggested to yield the same ion pair as solvolysis. This difference led to the conclusion that the ionic species for the nitrosamide decomposition is a nitrogen-separated ion pair. This study was initiated on the assumption that BNB led to solvolytic ion pairs, but that both the intimate and solvent-separated ion pairs were produced directly from the nitrosamide. The use of α-tritiated BNB for the study of partitioning isotope effects (PIE's) in this system led to activity ratios much lower than expected from other reported work. Results of studies of ''special'' salt effect were not consistent for all situations, but the results do suggest that the assumption that BNB leads to solvolytic ion pairs is probably valid. The investigation of the more stable p-methoxybenzhydryl benzoate system proved to be highly productive. The ester fraction produced, R, responded dramatically to the addition of common-ion as well as ''special'' salts. The functional relationship of R on salt concentration could be explained in terms of Winstein's solvolytic scheme where the intimate ion pair, the solvent-separated ion pair, and the dissociated ion were important. Tritium-labelled compounds were used for PIE studies on 3 different compounds, and three different methods of reaction are proposed

Multiple imaging mode X-ray computed tomography for distinguishing active and inactive phases in lithium-ion battery cathodes

Science.gov (United States)

Komini Babu, Siddharth; Mohamed, Alexander I.; Whitacre, Jay F.; Litster, Shawn

2015-06-01

This paper presents the use of nanometer scale resolution X-ray computed tomography (nano-CT) in the three-dimensional (3D) imaging of a Li-ion battery cathode, including the separate volumes of active material, binder plus conductive additive, and pore. The different high and low atomic number (Z) materials are distinguished by sequentially imaging the lithium cobalt oxide electrode in absorption and then Zernike phase contrast modes. Morphological parameters of the active material and the additives are extracted from the 3D reconstructions, including the distribution of contact areas between the additives and the active material. This method could provide a better understanding of the electric current distribution and structural integrity of battery electrodes, as well as provide detailed geometries for computational models.

Multi-scale approach to radiation damage induced by ion beams: complex DNA damage and effects of thermal spikes

International Nuclear Information System (INIS)

Surdutovich, E.; Yakubovich, A.V.; Solov'yov, A.V.; Surdutovich, E.; Yakubovich, A.V.; Solov'yov, A.V.

2010-01-01

We present the latest advances of the multi-scale approach to radiation damage caused by irradiation of a tissue with energetic ions and report the calculations of complex DNA damage and the effects of thermal spikes on biomolecules. The multi-scale approach aims to quantify the most important physical, chemical, and biological phenomena taking place during and following irradiation with ions and provide a better means for clinically-necessary calculations with adequate accuracy. We suggest a way of quantifying the complex clustered damage, one of the most important features of the radiation damage caused by ions. This quantification allows the studying of how the clusterization of DNA lesions affects the lethality of damage. We discuss the first results of molecular dynamics simulations of ubiquitin in the environment of thermal spikes, predicted to occur in tissue for a short time after an ion's passage in the vicinity of the ions' tracks. (authors)

Charge mechanism analysis of lithium ion secondary battery. X-ray absorption spectroscopy and first-principles calculations

International Nuclear Information System (INIS)

Kubobuchi, Kei; Imai, Hideto

2015-01-01

Redox reaction behaviors of a lithium ion secondary battery were investigated by K-edge in-situ XANES and L-edge XANES measurements combined with ab initio XANES simulation. During the charge process, the shape of K-edge XANES spectra was found to change, suggesting contribution of Mn 3d electron to charge and discharge. The detailed analysis based on first-principles electronic structure calculation and ab initio XANES simulation, however, indicated that valence change of Mn is little and rather O largely contribute to the reaction. (author)

Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method.

Science.gov (United States)

Konicek, Andrew R; Lefman, Jonathan; Szakal, Christopher

2012-08-07

We present a novel method for correlating and classifying ion-specific time-of-flight secondary ion mass spectrometry (ToF-SIMS) images within a multispectral dataset by grouping images with similar pixel intensity distributions. Binary centroid images are created by employing a k-means-based custom algorithm. Centroid images are compared to grayscale SIMS images using a newly developed correlation method that assigns the SIMS images to classes that have similar spatial (rather than spectral) patterns. Image features of both large and small spatial extent are identified without the need for image pre-processing, such as normalization or fixed-range mass-binning. A subsequent classification step tracks the class assignment of SIMS images over multiple iterations of increasing n classes per iteration, providing information about groups of images that have similar chemistry. Details are discussed while presenting data acquired with ToF-SIMS on a model sample of laser-printed inks. This approach can lead to the identification of distinct ion-specific chemistries for mass spectral imaging by ToF-SIMS, as well as matrix-assisted laser desorption ionization (MALDI), and desorption electrospray ionization (DESI).

Quantification and micron-scale imaging of spatial distribution of trace beryllium in shrapnel fragments and metallurgic samples with correlative fluorescence detection method and secondary ion mass spectrometry (SIMS).

Science.gov (United States)

Abraham, J L; Chandra, S; Agrawal, A

2014-11-01

Recently, a report raised the possibility of shrapnel-induced chronic beryllium disease from long-term exposure to the surface of retained aluminum shrapnel fragments in the body. Since the shrapnel fragments contained trace beryllium, methodological developments were needed for beryllium quantification and to study its spatial distribution in relation to other matrix elements, such as aluminum and iron, in metallurgic samples. In this work, we developed methodology for quantification of trace beryllium in samples of shrapnel fragments and other metallurgic sample-types with main matrix of aluminum (aluminum cans from soda, beer, carbonated water and aluminum foil). Sample preparation procedures were developed for dissolving beryllium for its quantification with the fluorescence detection method for homogenized measurements. The spatial distribution of trace beryllium on the sample surface and in 3D was imaged with a dynamic secondary ion mass spectrometry instrument, CAMECA IMS 3f secondary ion mass spectrometry ion microscope. The beryllium content of shrapnel (∼100 ppb) was the same as the trace quantities of beryllium found in aluminum cans. The beryllium content of aluminum foil (∼25 ppb) was significantly lower than cans. SIMS imaging analysis revealed beryllium to be distributed in the form of low micron-sized particles and clusters distributed randomly in X-Y- and Z dimensions, and often in association with iron, in the main aluminum matrix of cans. These observations indicate a plausible formation of Be-Fe or Al-Be alloy in the matrix of cans. Further observations were made on fluids (carbonated water) for understanding if trace beryllium in cans leached out and contaminated the food product. A direct comparison of carbonated water in aluminum cans and plastic bottles revealed that beryllium was below the detection limits of the fluorescence detection method (∼0.01 ppb). These observations indicate that beryllium present in aluminum matrix was either

Development of the simulation package 'ELSES' for extra-large-scale electronic structure calculation

Energy Technology Data Exchange (ETDEWEB)

Hoshi, T [Department of Applied Mathematics and Physics, Tottori University, Tottori 680-8550 (Japan); Fujiwara, T [Core Research for Evolutional Science and Technology, Japan Science and Technology Agency (CREST-JST) (Japan)

2009-02-11

An early-stage version of the simulation package 'ELSES' (extra-large-scale electronic structure calculation) is developed for simulating the electronic structure and dynamics of large systems, particularly nanometer-scale and ten-nanometer-scale systems (see www.elses.jp). Input and output files are written in the extensible markup language (XML) style for general users. Related pre-/post-simulation tools are also available. A practical workflow and an example are described. A test calculation for the GaAs bulk system is shown, to demonstrate that the present code can handle systems with more than one atom species. Several future aspects are also discussed.

Simulation of FIB-SEM images for analysis of porous microstructures.

Science.gov (United States)

Prill, Torben; Schladitz, Katja

2013-01-01

Focused ion beam nanotomography-scanning electron microscopy tomography yields high-quality three-dimensional images of materials microstructures at the nanometer scale combining serial sectioning using a focused ion beam with SEM. However, FIB-SEM tomography of highly porous media leads to shine-through artifacts preventing automatic segmentation of the solid component. We simulate the SEM process in order to generate synthetic FIB-SEM image data for developing and validating segmentation methods. Monte-Carlo techniques yield accurate results, but are too slow for the simulation of FIB-SEM tomography requiring hundreds of SEM images for one dataset alone. Nevertheless, a quasi-analytic description of the specimen and various acceleration techniques, including a track compression algorithm and an acceleration for the simulation of secondary electrons, cut down the computing time by orders of magnitude, allowing for the first time to simulate FIB-SEM tomography. © Wiley Periodicals, Inc.

DNA-based Nanoconstructs for the Detection of Ions and Biomolecules with Related Raman/SERS Signature Studies

Science.gov (United States)

Brenneman, Kimber L.

The utilization of DNA aptamers and semiconductor quantum dots (QDs) for the detection of ions and biomolecules was investigated. In recent years, there have been many studies based on the use of DNA and RNA aptamers, which are single stranded oligonucleotides capable of binding to biomolecules, other molecules, and ions. In many of these cases, the conformational changes of these DNA and RNA aptamers are suitable to use fluorescence resonant energy transfer (FRET) or nanometal surface energy transfer (NSET) techniques to detect such analytes. Coupled with this growth in such uses of aptamers, there has been an expanded use of semiconductor quantum dots as brighter, longer-lasting alternatives to fluorescent dyes in labeling and detection techniques of interest in biomedicine and environmental monitoring. Thrombin binding aptamer (TBA) and a zinc aptamer were used to detect mercury, lead, zinc, and cadmium. These probes were tested in a liquid assay as well as on a filter paper coupon. Biomolecules were also studied and detected using surface-enhanced Raman spectroscopy (SERS), including DNA aptamers and C-reactive protein (CRP). Raman spectroscopy is a useful tool for sensor development, label-free detection, and has the potential for remote sensing. Raman spectra provide information on the vibrational modes or phonons, between and within molecules. Therefore, unique spectral fingerprints for single molecules can be obtained. SERS is accomplished through the use of substrates with nanometer scale geometries made of metals with many free electrons, such as silver, gold, or copper. In this research silver SERS substrates were used to study the SERS signature of biomolecules that typically produce very weak Raman signals.

Scaling of heavy ion beam probes for reactor-size devices

International Nuclear Information System (INIS)

Hickok, R.L.; Jennings, W.C.; Connor, K.A.; Schoch, P.M.

1984-01-01

Heavy ion beam probes for reactor-size plasma devices will require beam energies of approximately 10 MeV. Although accelerator technology appears to be available, beam deflection systems and parallel plate energy analyzers present severe difficulties if existing technology is scaled in a straightforward manner. We propose a different operating mode which will use a fixed beam trajectory and multiple cylindrical energy analyzers. Development effort will still be necessary, but we believe the basic technology is available

Heavy-ion irradiation induced diamond formation in carbonaceous materials

International Nuclear Information System (INIS)

Daulton, T. L.

1999-01-01

The basic mechanisms of metastable phase formation produced under highly non-equilibrium thermodynamic conditions within high-energy particle tracks are investigated. In particular, the possible formation of diamond by heavy-ion irradiation of graphite at ambient temperature is examined. This work was motivated, in part, by earlier studies which discovered nanometer-grain polycrystalline diamond aggregates of submicron-size in uranium-rich carbonaceous mineral assemblages of Precambrian age. It was proposed that the radioactive decay of uranium formed diamond in the fission particle tracks produced in the carbonaceous minerals. To test the hypothesis that nanodiamonds can form by ion irradiation, fine-grain polycrystalline graphite sheets were irradiated with 400 MeV Kr ions. The ion irradiated graphite (and unirradiated graphite control) were then subjected to acid dissolution treatments to remove the graphite and isolate any diamonds that were produced. The acid residues were then characterized by analytical and high-resolution transmission electron microscopy. The acid residues of the ion-irradiated graphite were found to contain ppm concentrations of nanodiamonds, suggesting that ion irradiation of bulk graphite at ambient temperature can produce diamond

Nano-sized surface modifications induced by the impact of slow highly charged ions - A first review

International Nuclear Information System (INIS)

Aumayr, F.; El-Said, A.S.; Meissl, W.

2008-01-01

Irradiation of crystalline solid targets with swift heavy ions can lead to the formation of latent tracks in the solid and the creation of (mostly-hillock type) nanostructures on the surface. Recently similar surface modifications with nanometer dimensions have been demonstrated for the impact of individual, very slow but highly charged ions on various surfaces. We will review the current state of this new field of research. In particular we will discuss the circumstances and conditions under which nano-sized features (hillocks or craters) on different surfaces due to impact of slow highly charged ions can be produced. The use of slow highly charged ions instead of swift heavy ions might be of considerable interest for some practical applications

Mass spectroscopy of recoiled ions, secondary ion mass spectroscopy, and Auger electron spectroscopy investigation of Y2O3-stabilized ZrO2(100) and (110)

International Nuclear Information System (INIS)

Herman, G.S.; Henderson, M.A.; Starkweather, K.A.; McDaniel, E.P.

1999-01-01

We have studied the (100) and (110) surfaces of yttria-stabilized cubic ZrO 2 using Auger electron spectroscopy, low energy electron diffraction (LEED), direct recoil spectroscopy, mass spectroscopy of recoiled ions (MSRI), and secondary ion mass spectroscopy (SIMS). The concentration of yttrium at the surface was weakly influenced by the surface structure under the experimental conditions investigated. Both MSRI and SIMS indicated a more enhanced yttrium signal than zirconium signal at the surface compared to the respective bulk concentrations. The surfaces were not very well ordered as indicated by LEED. The yttria-stabilized cubic ZrO 2 single crystal surfaces may not be a suitable model material for pure phase ZrO 2 surfaces due to significant yttria concentrations at the surface. copyright 1999 American Vacuum Society

Electrokinetic flows in cylindrical and slit capillaries in clays: from pore scale to sample scale

International Nuclear Information System (INIS)

Obliger, Amael; Jardat, Marie; Rotenberg, Benjamin; Duvail, Magali; Bekri, Samir; Coelho, Daniel

2012-01-01

Document available in extended abstract form only. Full text of publication follows: Transport on the nanometer scale of clay interlayers and on the macroscopic sample scale can be well characterized experimentally, using either X-ray or neutron diffraction and diffusion on the one hand, and solute diffusion experiments on the other hand. Current imaging techniques do not allow to provide a direct picture of the pore network on the scale of several nanometers to several micrometers. The lack of knowledge of the pore network structure on intermediate scales requires to use numerical models of analog porous media. We attempt to describe the ionic transport in meso (diam. ∼ 10-50 nm) and macro-porosity (diam. > 50 nm) (due to the organization of clays particles) with a multi-scale approach provided by the Pore Network Model (PNM) that takes into consideration the topology of the media. Such an approach requires to know the transport coefficients of solvent and solutes in a throat connecting two pores, modelled as a capillary. The challenge in the case of clays, compared to the usual PNM methods, is to capture the effect of the surface charge of clay minerals on the transport of ions and water, under the effect of macroscopic pressure, salt concentration and electric potential gradients. Solvent and ionic transports are governed by the Stokes, the Nernst-Planck and the Poisson- Boltzmann equations. This set of equations can be solved analytically using the linearized form of the latter in order to get an approximation of the electro-osmotic speed and the ionic density profile. At variant with most previous works, we consider the case of a fixed surface charge instead of fixed surface potential. In addition to the Nernst-Einstein and chemical flows of solute, we calculated analytically the Poiseuille flow of solutes and the electro-osmotic flow of solvent and solutes. When the linearization is not possible, one must use numerical results for transport coefficients

Comparison of specular H-atomic-beam intensity and C+ secondary-ion yield at thermally activated decrease of a carbon layer on a Ni(110) surface

International Nuclear Information System (INIS)

Kaarmann, H.; Hoinkes, H.; Wilsch, H.

1983-01-01

The thermally activated disappearance of a carbon layer on a Ni(110) surface was investigated by the scattering of atomic hydrogen and by secondary-ion mass spectrometry. Decreasing C coverage at surface temperatures kept constant in each case at values between 650 and 750 K resulted in an exponential decrease of specular H-beam intensity as well as C + secondary-ion yield. This decrease in both cases fits first-order kinetics (presumable diffusion into the bulk) with an identical rate constant as a function of surface temperature and results finally in a preexponential frequency ν = 10/sup() 10plus-or-minus1/ s -1 and an activation energy E/sub A/ = 1.8 +- 0.2 eV

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

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Patrick Philipp

2016-11-01

Full Text Available The analysis of polymers by secondary ion mass spectrometry (SIMS has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM, which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.

Surface behavior based on ion-induced secondary electron emission from semi-insulating materials in breakdown evolution

Energy Technology Data Exchange (ETDEWEB)

Koc, Emrah; Karakoese, Sema [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Salamov, Bahtiyar G. [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Institute of Physics, National Academy of Science, 1143 Baku (Azerbaijan)

2013-09-15

This study focuses on analyses of secondary electron emission (SEE) at semiconductor surfaces when the sufficient conditions of space-time distribution occur. Experimental measurements and calculations with the approach of Townsend coefficients, which include the evaluations of ionization coefficient ({alpha}) and SEE coefficient ({gamma}) were performed in high-ohmic InP, GaAs, and Si semiconductor cathodes with argon and air environments in a wide range of E/N (300-10 000 Td). The direct calculations of {gamma} were carried out to determine the behavior of cold-semiconductor cathode current in a wide range of microgaps (45-525 {mu}m). Paschen curves are interpreted in the dependence of large pd range on breakdown voltage through {gamma} and {alpha}/N. Ion-induced secondary electrons exhibit the direct behaviors affecting the timescale of breakdown evolution in the vicinity of the Paschen minimum during the natural bombardment process with ions of semiconductor cathodes. Also, when {alpha}/N rapidly drops and the excitations of gas atoms densely occupy the gas volume, we determined that the photoelectric effect provides a growth for electron emission from semiconductor surfaces at the breakdown stage at the reduced values of E/N. At all pressures, the emission magnitudes of electrons liberated by semiconductor cathodes into vacuum are found as {gamma}{sub InP} > {gamma}{sub GaAs} > {gamma}{sub Si} in breakdown evolution. (copyright 2013 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Challenges of fabricating plasmonic and photonic structures with Neon ion beam milling