Resolution Improvement and Pattern Generator Development for the Maskless Micro-Ion-Beam Reduction Lithography System

International Nuclear Information System (INIS)

Jiang, Ximan

2006-01-01

The shrinking of IC devices has followed the Moore's Law for over three decades, which states that the density of transistors on integrated circuits will double about every two years. This great achievement is obtained via continuous advance in lithography technology. With the adoption of complicated resolution enhancement technologies, such as the phase shifting mask (PSM), the optical proximity correction (OPC), optical lithography with wavelength of 193 nm has enabled 45 nm printing by immersion method. However, this achievement comes together with the skyrocketing cost of masks, which makes the production of low volume application-specific IC (ASIC) impractical. In order to provide an economical lithography approach for low to medium volume advanced IC fabrication, a maskless ion beam lithography method, called Maskless Micro-ion-beam Reduction Lithography (MMRL), has been developed in the Lawrence Berkeley National Laboratory. The development of the prototype MMRL system has been described by Dr. Vinh Van Ngo in his Ph.D. thesis. But the resolution realized on the prototype MMRL system was far from the design expectation. In order to improve the resolution of the MMRL system, the ion optical system has been investigated. By integrating a field-free limiting aperture into the optical column, reducing the electromagnetic interference and cleaning the RF plasma, the resolution has been improved to around 50 nm. Computational analysis indicates that the MMRL system can be operated with an exposure field size of 0.25 mm and a beam half angle of 1.0 mrad on the wafer plane. Ion-ion interactions have been studied with a two-particle physics model. The results are in excellent agreement with those published by the other research groups. The charge-interaction analysis of MMRL shows that the ion-ion interactions must be reduced in order to obtain a throughput higher than 10 wafers per hour on 300-mm wafers. In addition, two different maskless lithography strategies

Mechanical properties of micro-sized copper bending beams machined by the focused ion beam technique

International Nuclear Information System (INIS)

Motz, C.; Schoeberl, T.; Pippan, R.

2005-01-01

Micro-sized bending beams with thicknesses, t, from 7.5 down to 1.0 μm were fabricated with the focused ion beam technique from a copper single crystal with an {1 1 1} orientation. The beams were loaded with a nano-indenter and the force vs. displacement curves were recorded. A strong size effect was found where the flow stress reaches almost 1 GPa for the thinnest beams. A common strain gradient plasticity approach was used to explain the size effect. However, the strong t -1.14 dependence of the flow stress could not be explained by this model. Additionally, the combination of two other dislocation mechanisms is discussed: the limitation of available dislocation sources and a dislocation pile-up at the beam centre. The contribution of the pile-up stress to the flow stress gives a t -1 dependence, which is in good agreement with the experimental results

Electrostatic mechanism of shaping the wave micro-relief on the surface of a semiconductor, sputtered by an ion beam

International Nuclear Information System (INIS)

Grigor'ev, A.I.

2000-01-01

The effect of the electric field formed due to the surface charging, is not accounted for in the weakly-developed theoretical models for the ordered micro-relief formation on the surface of a semiconductor under the impact of an ion beam. It is shown, that the problem on modeling the physical mechanism of forming the ordered wave micro-relief on the semiconductor surface under the impact of a high-energy ion beam may be interpreted as an electrostatic one [ru

Ion beam analysis in cultural heritage studies: Milestones and perspectives

International Nuclear Information System (INIS)

Dran, Jean-Claude; Calligaro, Thomas

2013-01-01

For three decades, ion beam analysis (IBA) in external mode was considered as the best choice for the characterisation of cultural heritage materials, as it combines excellent analytical performance and non-invasive character. However, in recent years, other analytical techniques arose as serious competitors, such as those based on synchrotron radiation (X-ray absorption, fluorescence or diffraction) or those using portable instruments (XRF, micro-Raman). It is shown that nevertheless IBA remains unmatched thanks to two unique features, namely the analysis of light elements and the high-resolution 3D chemical imaging

Fabrication of phosphor micro-grids using proton beam lithography

International Nuclear Information System (INIS)

Rossi, Paolo; Antolak, Arlyn J.; Provencio, Paula Polyak; Doyle, Barney Lee; Malmqvist, Klas; Hearne, Sean Joseph; Nilsson, Christer; Kristiansson, Per; Wegden, Marie; Elfman, Mikael; Pallon, Jan; Auzelyte, Vaida

2005-01-01

A new nuclear microscopy technique called ion photon emission microscopy or IPEM was recently invented. IPEM allows analysis involving single ions, such as ion beam induced charge (IBIC) or single event upset (SEU) imaging using a slightly modified optical microscope. The spatial resolution of IPEM is currently limited to more than 10 (micro)m by the scattering and reflection of ion-induced photons, i.e. light blooming or spreading, in the ionoluminescent phosphor layer. We are developing a 'Microscopic Gridded Phosphor' (also called Black Matrix) where the phosphor nanocrystals are confined within the gaps of a micrometer scale opaque grid, which limits the amount of detrimental light blooming. MeV-energy proton beam lithography is ideally suited to lithographically form masks for the grid because of high aspect ratio, pattern density and sub-micron resolution of this technique. In brief, the fabrication of the grids was made in the following manner: (1) a MeV proton beam focused to 1.5-2 (micro)m directly fabricated a matrix of pillars in a 15 (micro)m thick SU-8 lithographic resist; (2) 7:1 aspect ratio pillars were then formed by developing the proton exposed area; (3) Ni (Au) was electrochemically deposited onto Cu-coated Si from a sulfamate bath (or buffered CN bath); (4) the SU-8 pillars were removed by chemical etching; finally (5) the metal micro-grid was freed from its substrate by etching the underlying Cu layer. Our proposed metal micro-grids promise an order-of-magnitude improvement in the resolution of IPEM.

Light ion microbeam analysis / processing system and its improvement

International Nuclear Information System (INIS)

Koka, Masashi; Ishii, Yasuyuki; Yamada, Naoto; Ohkubo, Takeru; Kamiya, Tomihiro; Satoh, Takahiro; Kada, Wataru; Kitamura, Akane; Iwata, Yoshihiro

2016-03-01

A MeV-class light ion microbeam system has been developed for micro-analysis and micro-fabrication with high spatial resolution at 3-MV single-ended accelerator in Takasaki Ion Accelerators for Advanced Radiation Application of Takasaki Advanced Radiation Research Institute, Sector of Nuclear Science Research, Japan Atomic Energy Agency. This report describes the technical improvements for the main apparatus (the accelerator, beam-transport lines, and microbeam system), and auxiliary equipments/ parts for ion beam applications such as Particle Induced X-ray/Gamma-ray Emission (PIXE/PIGE) analysis, 3-D element distribution analysis using PIXE Computed Tomography (CT), Ion Beam Induced Luminescence (IBIL) analysis, and Proton Beam Writing with the microbeam scanning, with functional outline of these apparatus and equipments/parts. (author)

Development of Emittance Analysis Software for Ion Beam Characterization

International Nuclear Information System (INIS)

Padilla, M.J.; Liu, Yuan

2007-01-01

Transverse beam emittance is a crucial property of charged particle beams that describes their angular and spatial spread. It is a figure of merit frequently used to determine the quality of ion beams, the compatibility of an ion beam with a given beam transport system, and the ability to suppress neighboring isotopes at on-line mass separator facilities. Generally, a high-quality beam is characterized by a small emittance. In order to determine and improve the quality of ion beams used at the Holifield Radioactive Ion Beam Facility (HRIBF) for nuclear physics and nuclear astrophysics research, the emittances of the ion beams are measured at the off-line Ion Source Test Facilities. In this project, emittance analysis software was developed to perform various data processing tasks for noise reduction, to evaluate root-mean-square emittance, Twiss parameters, and area emittance of different beam fractions. The software also provides 2D and 3D graphical views of the emittance data, beam profiles, emittance contours, and RMS. Noise exclusion is essential for accurate determination of beam emittance values. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is employed. Numerical data analysis techniques such as interpolation and nonlinear fitting are also incorporated into the software. The software will provide a simplified, fast tool for comprehensive emittance analysis. The main functions of the software package have been completed. In preliminary tests with experimental emittance data, the analysis results using the software were shown to be accurate

DEVELOPMENT OF EMITTANCE ANALYSIS SOFTWARE FOR ION BEAM CHARACTERIZATION

Energy Technology Data Exchange (ETDEWEB)

Padilla, M. J.; Liu, Y.

2007-01-01

Transverse beam emittance is a crucial property of charged particle beams that describes their angular and spatial spread. It is a fi gure of merit frequently used to determine the quality of ion beams, the compatibility of an ion beam with a given beam transport system, and the ability to suppress neighboring isotopes at on-line mass separator facilities. Generally a high quality beam is characterized by a small emittance. In order to determine and improve the quality of ion beams used at the Holifi eld Radioactive Ion beam Facility (HRIBF) for nuclear physics and nuclear astrophysics research, the emittances of the ion beams are measured at the off-line Ion Source Test Facilities. In this project, emittance analysis software was developed to perform various data processing tasks for noise reduction, to evaluate root-mean-square emittance, Twiss parameters, and area emittance of different beam fractions. The software also provides 2D and 3D graphical views of the emittance data, beam profi les, emittance contours, and RMS. Noise exclusion is essential for accurate determination of beam emittance values. A Self-Consistent, Unbiased Elliptical Exclusion (SCUBEEx) method is employed. Numerical data analysis techniques such as interpolation and nonlinear fi tting are also incorporated into the software. The software will provide a simplifi ed, fast tool for comprehensive emittance analysis. The main functions of the software package have been completed. In preliminary tests with experimental emittance data, the analysis results using the software were shown to be accurate.

Ion beams provided by small accelerators for material synthesis and characterization

Science.gov (United States)

Mackova, Anna; Havranek, Vladimir

2017-06-01

The compact, multipurpose electrostatic tandem accelerators are extensively used for production of ion beams with energies in the range from 400 keV to 24 MeV of almost all elements of the periodic system for the trace element analysis by means of nuclear analytical methods. The ion beams produced by small accelerators have a broad application, mainly for material characterization (Rutherford Back-Scattering spectrometry, Particle Induced X ray Emission analysis, Nuclear Reaction Analysis and Ion-Microprobe with 1 μm lateral resolution among others) and for high-energy implantation. Material research belongs to traditionally progressive fields of technology. Due to the continuous miniaturization, the underlying structures are far beyond the analytical limits of the most conventional methods. Ion Beam Analysis (IBA) techniques provide this possibility as they use probes of similar or much smaller dimensions (particles, radiation). Ion beams can be used for the synthesis of new progressive functional nanomaterials for optics, electronics and other applications. Ion beams are extensively used in studies of the fundamental energetic ion interaction with matter as well as in the novel nanostructure synthesis using ion beam irradiation in various amorphous and crystalline materials in order to get structures with extraordinary functional properties. IBA methods serve for investigation of materials coming from material research, industry, micro- and nano-technology, electronics, optics and laser technology, chemical, biological and environmental investigation in general. Main research directions in laboratories employing small accelerators are also the preparation and characterization of micro- and nano-structured materials which are of interest for basic and oriented research in material science, and various studies of biological, geological, environmental and cultural heritage artefacts are provided too.

Application of micro beam PIXE to detection of titanium ion release from dental and orthopaedic implants

International Nuclear Information System (INIS)

Ektessabi, A.M.; Otsuka, T.; Tsuboi, Y.; Yokoyama, K.; Albrektsson, T.; Sennerby, L.; Johansson, C.

1994-01-01

In the past two decades the utilization of dental and orthopaedic implants in reconstructive surgery has been spread widely. Most of these implants are inserted in the corrosive environment of the human body for long periods of time. The level of dissolution, release, and transport of metal ions as a result of corrosion of these materials are not fully known at present. We report the results of application of micro ion beam PIXE spectroscopy to detect release of titanium from titanium and titanium alloy implants inserted in the tibiae of rabbits for three months. It was found that titanium ions could be detected in the surrounding tissues, with high precision, as a gradient from the implant surface and in higher amounts in the bone tissue as compared with the soft tissues. It is concluded that application of micro ion beam PIXE spectroscopy for detection of metal ion release, and distribution of the released material around the implants with high special resolution and accuracy may be used to further investigate the mechanism of metal release, and the relation between surface micromorphology and corrosion resistance of the implant materials. (author)

The nuclear interaction analysis methods for diagnostics of high power ion beam technologies

Energy Technology Data Exchange (ETDEWEB)

Ryzhkov, V A; Grushin, I I; Remnev, G E [Nuclear Physics Inst., Tomsk (Russian Federation)

1997-12-31

The complex of Nuclear Interaction Analysis Methods including charged particle activation analysis (CPAA and HIAA), spectrometry of ion induced gamma-emission (PIGE and HIIGE) , characteristic X-ray emission (PIXE), and Rutherford Backscattering Spectrometry (RBS), have been used for diagnostics of the High Power Ion Beam (HPIB) assisted technologies. Accelerated ion beams from the EG-2.5 electrostatic generator and U-120 cyclotron were used for implementation of the techniques. The complex allows a lot of problems of elemental and isotopic analysis to be addressed. First, it is the determination of micro- and macrocomponents of modified materials; second, determination of surface density of thin films, multilayers and coatings, total surface gaseous contamination and amounts of the elements implanted in specimens; third, measurement of concentration depth profiles of the elements. Experiments have shown that the preferable application of nuclear analysis methods allows us to avoid the considerable errors arising when the concentration depth profiles of elements are measured by SIMS or AES in studies of mass transfer processes induced by HPIBs. (author). 1 tab., 2 figs., 3 refs.

The use of micro-computers in the simulation of ion beam optics

International Nuclear Information System (INIS)

Spaedtke, P.; Ivens, D.

1989-01-01

With computer simulation codes specific problems of the ion beam optics can be studied, which is useful in the design as in optimization of existing systems. Several such codes have been developed, unfortunately requiring substantial computer resources. Recent advances of mini- and micro-computers have now made it possible to develop simulation codes which can be run on these small computers also. In this paper, some of these codes will be presented and their computing time discussed. (author)

Plasma ion sources and ion beam technology in microfabrications

International Nuclear Information System (INIS)

Ji, Lili

2007-01-01

For over decades, focused ion beam (FIB) has been playing a very important role in microscale technology and research, among which, semiconductor microfabrication is one of its biggest application area. As the dimensions of IC devices are scaled down, it has shown the need for new ion beam tools and new approaches to the fabrication of small-scale devices. In the meanwhile, nanotechnology has also deeply involved in material science research and bioresearch in recent years. The conventional FIB systems which utilize liquid gallium ion sources to achieve nanometer scale resolution can no longer meet the various requirements raised from such a wide application area such as low contamination, high throughput and so on. The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. In this thesis, three novel ion beam tools have been developed and investigated as the alternatives for the conventional FIB systems in some particular applications. An integrated focused ion beam (FIB) and scanning electron microscope (SEM) system has been developed for direct doping or surface modification. This new instrument employs a mini-RF driven plasma source to generate focused ion beam with various ion species, a FEI two-lens electron (2LE) column for SEM imaging, and a five-axis manipulator system for sample positioning. An all-electrostatic two-lens column has been designed to focus the ion beam extracted from the source. Based on the Munro ion optics simulation, beam spot sizes as small as 100 nm can be achieved at beam energies between 5 to 35 keV if a 5 (micro)m-diameter extraction aperture is used. Smaller beam spot sizes can be obtained with smaller apertures at sacrifice of some beam current. The FEI 2LE column, which utilizes Schottky emission, electrostatic focusing optics, and stacked-disk column construction, can provide high-resolution (as small as 20 nm) imaging capability, with fairly long working distance

Applications of laser produced ion beams to nuclear analysis of materials

International Nuclear Information System (INIS)

Mima, K.; Azuma, H.; Fujita, K.; Yamazaki, A.; Okuda, C.; Ukyo, Y.; Kato, Y.; Arrabal, R. Gonzalez; Soldo, F.; Perlado, J. M.; Nishimura, H.; Nakai, S.

2012-01-01

Laser produced ion beams have unique characteristics which are ultra-short pulse, very low emittance, and variety of nuclear species. These characteristics could be used for analyzing various materials like low Z ion doped heavy metals or ceramics. Energies of laser produced ion beam extend from 0.1MeV to 100MeV. Therefore, various nuclear processes can be induced in the interactions of ion beams with samples. The ion beam driven nuclear analysis has been developed for many years by using various electrostatic accelerators. To explore the applicability of laser ion beam to the analysis of the Li ion battery, a proton beam with the diameter of ∼ 1.0 μm at Takasaki Ion Acceleration for Advanced Radiation Application (TIARA), JAEA was used. For the analysis, the PIGE (Particle-Induced Gamma Ray Emission) is used. The proton beam scans over Li battery electrode samples to diagnose Li density in the LiNi 0.85 Co 0.15 O 2 anode. As the results, PIGE images for Li area density distributions are obtained with the spatial resolution of better than 1.5μm FWHM. By the Li PIGE images, the depth dependence of de-intercalation levels of Li in the anode is obtained. By the POP experiments at TIARA, it is clarified that laser produced ion beam is appropriate for the Li ion battery analysis. 41.85.Lc, 41.75.Jv, 42.62.cf.

Microfabricated Ion Beam Drivers for Magnetized Target Fusion

Science.gov (United States)

Persaud, Arun; Seidl, Peter; Ji, Qing; Ardanuc, Serhan; Miller, Joseph; Lal, Amit; Schenkel, Thomas

2015-11-01

Efficient, low-cost drivers are important for Magnetized Target Fusion (MTF). Ion beams offer a high degree of control to deliver the required mega joules of driver energy for MTF and they can be matched to several types of magnetized fuel targets, including compact toroids and solid targets. We describe an ion beam driver approach based on the MEQALAC concept (Multiple Electrostatic Quadrupole Array Linear Accelerator) with many beamlets in an array of micro-fabricated channels. The channels consist of a lattice of electrostatic quadrupoles (ESQ) for focusing and of radio-frequency (RF) electrodes for ion acceleration. Simulations with particle-in-cell and beam envelope codes predict >10x higher current densities compared to state-of-the-art ion accelerators. This increase results from dividing the total ion beam current up into many beamlets to control space charge forces. Focusing elements can be biased taking advantage of high breakdown electric fields in sub-mm structures formed using MEMS techniques (Micro-Electro-Mechanical Systems). We will present results on ion beam transport and acceleration in MEMS based beamlets. Acknowledgments: This work is supported by the U.S. DOE under Contract No. DE-AC02-05CH11231.

Ion beam analysis of metal ion implanted surfaces

Energy Technology Data Exchange (ETDEWEB)

Evans, P.J.; Chu, J.W.; Johnson, E.P.; Noorman, J.T. [Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW (Australia); Sood, D.K. [Royal Melbourne Inst. of Tech., VIC (Australia)

1993-12-31

Ion implantation is an established method for altering the surface properties of many materials. While a variety of analytical techniques are available for the characterisation of implanted surfaces, those based on particle accelerators such as Rutherford backscattering (RBS) and nuclear reaction analysis (NRA) provide some of the most useful and powerful for this purpose. Application of the latter techniques to metal ion implantation research at ANSTO will be described with particular reference to specific examples from recent studies. Where possible, the information obtained from ion beam analysis will be compared with that derived from other techniques such as Energy Dispersive X-ray (EDX) and Auger spectroscopies. 4 refs., 5 figs.

Ion beam analysis of metal ion implanted surfaces

Energy Technology Data Exchange (ETDEWEB)

Evans, P J; Chu, J W; Johnson, E P; Noorman, J T [Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW (Australia); Sood, D K [Royal Melbourne Inst. of Tech., VIC (Australia)

1994-12-31

Ion implantation is an established method for altering the surface properties of many materials. While a variety of analytical techniques are available for the characterisation of implanted surfaces, those based on particle accelerators such as Rutherford backscattering (RBS) and nuclear reaction analysis (NRA) provide some of the most useful and powerful for this purpose. Application of the latter techniques to metal ion implantation research at ANSTO will be described with particular reference to specific examples from recent studies. Where possible, the information obtained from ion beam analysis will be compared with that derived from other techniques such as Energy Dispersive X-ray (EDX) and Auger spectroscopies. 4 refs., 5 figs.

Ion beam analysis of metal ion implanted surfaces

International Nuclear Information System (INIS)

Evans, P.J.; Chu, J.W.; Johnson, E.P.; Noorman, J.T.; Sood, D.K.

1993-01-01

Ion implantation is an established method for altering the surface properties of many materials. While a variety of analytical techniques are available for the characterisation of implanted surfaces, those based on particle accelerators such as Rutherford backscattering (RBS) and nuclear reaction analysis (NRA) provide some of the most useful and powerful for this purpose. Application of the latter techniques to metal ion implantation research at ANSTO will be described with particular reference to specific examples from recent studies. Where possible, the information obtained from ion beam analysis will be compared with that derived from other techniques such as Energy Dispersive X-ray (EDX) and Auger spectroscopies. 4 refs., 5 figs

Development of a micro-tomography technique by ion beams

International Nuclear Information System (INIS)

Moretto, Ph.; Michelet, C.

1997-01-01

The capability for an ion beam to penetrate easily the matter is an original feature for the nuclear microprobe analysis when compared to other techniques. Information in death of the sample can thus be obtained. Scanning Transmission Ion Microscopy (STIM) takes advantage of this capability to provide two dimensional maps of the sample thickness. Cross-sectional images of an object may be calculated from a set of STIM projections allowing the determination of the three-dimensional structure. This is the principle of STIM-Tomography. When PIXE analysis is carried out rotating the object under investigation, the elemental 3-D chemical distribution may also be elucidated at a microscopic scale. (authors)

An ion beam analysis software based on ImageJ

International Nuclear Information System (INIS)

Udalagama, C.; Chen, X.; Bettiol, A.A.; Watt, F.

2013-01-01

The suit of techniques (RBS, STIM, ERDS, PIXE, IL, IF,…) available in ion beam analysis yields a variety of rich information. Typically, after the initial challenge of acquiring data we are then faced with the task of having to extract relevant information or to present the data in a format with the greatest impact. This process sometimes requires developing new software tools. When faced with such situations the usual practice at the Centre for Ion Beam Applications (CIBA) in Singapore has been to use our computational expertise to develop ad hoc software tools as and when we need them. It then became apparent that the whole ion beam community can benefit from such tools; specifically from a common software toolset that can be developed and maintained by everyone with freedom to use and allowance to modify. In addition to the benefits of readymade tools and sharing the onus of development, this also opens up the possibility for collaborators to access and analyse ion beam data without having to depend on an ion beam lab. This has the virtue of making the ion beam techniques more accessible to a broader scientific community. We have identified ImageJ as an appropriate software base to develop such a common toolset. In addition to being in the public domain and been setup for collaborative tool development, ImageJ is accompanied by hundreds of modules (plugins) that allow great breadth in analysis. The present work is the first step towards integrating ion beam analysis into ImageJ. Some of the features of the current version of the ImageJ ‘ion beam’ plugin are: (1) reading list mode or event-by-event files, (2) energy gates/sorts, (3) sort stacks, (4) colour function, (5) real time map updating, (6) real time colour updating and (7) median and average map creation

An ion beam analysis software based on ImageJ

Energy Technology Data Exchange (ETDEWEB)

Udalagama, C., E-mail: chammika@nus.edu.sg [Centre for Ion Beam Applications (CIBA), Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117 542 (Singapore); Chen, X.; Bettiol, A.A.; Watt, F. [Centre for Ion Beam Applications (CIBA), Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117 542 (Singapore)

2013-07-01

The suit of techniques (RBS, STIM, ERDS, PIXE, IL, IF,…) available in ion beam analysis yields a variety of rich information. Typically, after the initial challenge of acquiring data we are then faced with the task of having to extract relevant information or to present the data in a format with the greatest impact. This process sometimes requires developing new software tools. When faced with such situations the usual practice at the Centre for Ion Beam Applications (CIBA) in Singapore has been to use our computational expertise to develop ad hoc software tools as and when we need them. It then became apparent that the whole ion beam community can benefit from such tools; specifically from a common software toolset that can be developed and maintained by everyone with freedom to use and allowance to modify. In addition to the benefits of readymade tools and sharing the onus of development, this also opens up the possibility for collaborators to access and analyse ion beam data without having to depend on an ion beam lab. This has the virtue of making the ion beam techniques more accessible to a broader scientific community. We have identified ImageJ as an appropriate software base to develop such a common toolset. In addition to being in the public domain and been setup for collaborative tool development, ImageJ is accompanied by hundreds of modules (plugins) that allow great breadth in analysis. The present work is the first step towards integrating ion beam analysis into ImageJ. Some of the features of the current version of the ImageJ ‘ion beam’ plugin are: (1) reading list mode or event-by-event files, (2) energy gates/sorts, (3) sort stacks, (4) colour function, (5) real time map updating, (6) real time colour updating and (7) median and average map creation.

Micro-patterns fabrication using focused proton beam lithography

Energy Technology Data Exchange (ETDEWEB)

Cutroneo, M., E-mail: cutroneo@ujf.cas.cz [Nuclear Physics Institute, AS CR, 25068 Rez (Czech Republic); Havranek, V. [Nuclear Physics Institute, AS CR, 25068 Rez (Czech Republic); Mackova, A. [Nuclear Physics Institute, AS CR, 25068 Rez (Czech Republic); Department of Physics, Faculty of Science, J.E. Purkinje University, Ceske mladeze 8, 400 96 Usti nad Labem (Czech Republic); Semian, V. [Nuclear Physics Institute, AS CR, 25068 Rez (Czech Republic); Torrisi, L. [Department of Physics and Earth Sciences, Messina University, V.le F.S. d’Alcontres 31, 98166 S. Agata, Messina (Italy); Calcagno, L. [Department of Physics, Catania University, V. S. Sofia 64, 95123 Catania (Italy)

2016-03-15

Proton beam writing technique was recently introduced at 3MV Tandetron accelerator at Nuclear Physics Institute in Rez (Czech Republic). It has been used, to produce three-dimensional (3D) micro-structures in poly(methylmethacrylate) by 2.0 MeV and 2.6 MeV protons micro-beam. Micro-channels (52 μm × 52 μm) have been realized. After chemical etching, the quality of the bottom and side walls of the produced structures in PMMA were analyzed using Scanning Transmission Ion Microscopy (STIM).

Surrey Ion Beam Centre: the EPSRC MRF for ion beam applications - 01002

International Nuclear Information System (INIS)

Webb, R.P.

2016-01-01

The SIBC (Surrey Ion Beam Centre) is an element of the Virtual Ion Beam Centre that coordinates 3 U.K. experimental facilities: SIBC (University of Surrey) for implantation and ion beam applications, Miami and MEIS facility (University of Huddersfield) and gamma ray and neutron irradiation emulation facility (University of Manchester). The SIBC works actively with industry, developing bespoke processes and services, particularly for the photonics industry and provides ion beam facilities to about 20 companies across the world. It operates a stringent quality control program and is one of the few ion beam laboratories in the world to operate under ISO 9001 certification. The equipment of SIBC is presented and some applications of ion beam analysis concerning the identification of gunshot residues, the determination of the origin of a painting, the analysis of proteins are described. Different techniques such as PIXE (Particle Induced X-ray Emission), RBS (Rutherford Backscattering Spectroscopy), NRA (Nuclear Reaction Analysis), SIMS (Secondary Ion Mass Spectrometry) are also explained in the slides of the presentation that have been added at the end of the paper

Biological response to radiation. Studies of model organism, C. elegans, with micro-ion beam

International Nuclear Information System (INIS)

Higashitani, Atsushi

2006-01-01

Described are mainly author's studies on radiation response and its biological significance in a nematode, C. elegans, particularly focusing its germ cells. The model organism is bisexual and the mature one is suitable to observe the development, differentiation and concomitant chromosome dynamics of male and female germ cells, and accordingly, the responses occurring in those cells at different stages post irradiation of the whole worm. Authors have shown in the organism irradiated by 100 Gy X-ray that pachytene cells in meiosis have high radio-resistance due to their increased expression of enzymes related with homologous recombination. They have also presented the apoptotic cascade in germ cells triggered by radiation by comparison of wild type and ab1-1-gene-deleted worms. Micro-beam of 12 C 5+ ion in Takasaki Ion Accelerators for Advanced Radiation Application (TIARA) has been used to irradiate the body parts of the worm to study the bystander effects, which has revealed that germ cells are shielded from the effect in the worm. It is thought important to use the micro-beam, with which the irradiation area can be precisely controllable, for studying the bystander effect in a body of higher animals like a mouse as well as in worm somatic cells. (T.I.)

Ion beams in materials processing and analysis

CERN Document Server

Schmidt, Bernd

2012-01-01

This book covers ion beam application in modern materials research, offering the basics of ion beam physics and technology and a detailed account of the physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning.

Establishment of an ASEAN Ion Beam Analysis Centre for Material Characterizations at Chiang Mai University

International Nuclear Information System (INIS)

Kamwanna, T.; Junphong, P.; Yu, L.D.; Singkarat, S.; Intarasiri, S.; Suwannakachorn, D.

2015-01-01

A comprehensive ion beam analysis centre unique in the ASEAN (Association of Southeast Asian Nations) region has been established at Chiang Mai University, Thailand. The centre is equipped with a 1.7 MV Tandetron tandem accelerator and a 300 kV medium energy ion beam accelerator for ion beam analysis. The Tandetron accelerator employs two ion sources, a duoplasmatron ion source and a sputter ion source, capable of producing ion beams of both light species (hydrogen and helium) and heavy species. The beamline is currently able to perform ion beam analysis techniques, such as Rutherford backscattering spectrometry (RBS), RBS/channelling, elastic backscattering (EBS), particle induced x ray emission (PIXE) and ionoluminescence (IL) with the assistance of commercial and self-developed software. The medium energy ion accelerator features an ns pulsed beam so that time of flight (ToF) RBS analysis using medium energy ion beams is available for detailed analysis of materials. Ion beam analysis experiments and applications have been vigorously developed for the real time characterization of various materials. Examples are presented and qualities of the ion beam analysis techniques are discussed. (author)

Status of ion beam data analysis and simulation software

Energy Technology Data Exchange (ETDEWEB)

Rauhala, E. [Accelerator Laboratory, Department of Physics, University of Helsinki, P.O. Box 43, FIN-00014 Helsinki (Finland)]. E-mail: eero.rauhala@helsinki.fi; Barradas, N.P. [Instituto Tecnologico e Nuclear, Estrada Nacional No. 10, Apartado 21, 2686-953 Sacavem (Portugal); Centro de Fisica Nuclear da Universidade de Lisboa, Av. Prof. Gama Pinto 2, 1649-003 Lisbon (Portugal); Fazinic, S. [Rudjer Boskovic Institute, Bijenicka c.54, 10000 Zagreb (Croatia); Mayer, M. [Max-Planck-Institut fuer Plasmaphysik, EURATOM Association, Boltzmannstr. 2, D-85748 Garching (Germany); Szilagyi, E. [KFKI Research Institute for Particle and Nuclear Physics, P.O. Box 49, H-1525 Budapest (Hungary); Thompson, M. [Department of MS and E/Bard Hall 328, Cornell University, Ithaca, NY 14853 (United States)

2006-03-15

The status of ion beam data analysis codes dedicated to Rutherford backscattering, elastic recoil detection analysis and non-resonant nuclear reaction analysis, is reviewed. The most important methods and approaches employed are discussed. The stopping power and scattering cross-section databases used, the ion-target interaction physics, the experimental and detection system characteristics and the structure of samples all have a strong impact on the analytical results. The models and algorithms used by different codes are reviewed and discussed in detail. Limitations in existing codes and perspectives for further developments are presented. The importance of ascertaining the correctness and accuracy of different methods and codes used in ion beam data analysis is stressed.

Molecular-beam epitaxial growth and ion-beam analysis systems for functional materials research

International Nuclear Information System (INIS)

Takeshita, H.; Aoki, Y.; Yamamoto, S.; Naramoto, H.

1992-01-01

Experimental systems for molecular beam epitaxial growth and ion beam analysis have been designed and constructed for the research of inorganic functional materials such as thin films and superlattices. (author)

Focused ion beam milling of carbon fibres

International Nuclear Information System (INIS)

Huson, Mickey G.; Church, Jeffrey S.; Hillbrick, Linda K.; Woodhead, Andrea L.; Sridhar, Manoj; Van De Meene, Allison M.L.

2015-01-01

A focused ion beam has been used to mill both individual carbon fibres as well as fibres in an epoxy composite, with a view to preparing flat surfaces for nano-indentation. The milled surfaces have been assessed for damage using scanning probe microscopy nano-indentation and Raman micro-probe analysis, revealing that FIB milling damages the carbon fibre surface and covers surrounding areas with debris of disordered carbon. The debris is detected as far as 100 μm from the milling site. The energy of milling as well as the orientation of the beam was varied and shown to have an effect when assessed by Raman spectroscopy. - Highlights: • Focused ion beam (FIB) milling was used to mill flat surfaces on carbon fibres. • Raman spectroscopy showed amorphous carbon was generated during FIB milling. • The amorphous debris is detected as far as 100 μm from the milling site. • This surface degradation was confirmed by nano-indentation experiments.

Investigation of fish otoliths by combined ion beam analysis

International Nuclear Information System (INIS)

Huszank, R.; Simon, A.; Keresztessy, K.

2008-01-01

Complete text of publication follows. This work was implemented within the framework of the Hungarian Ion beam Physics Platform (http://hipp.atomki.hu/). Otoliths are small structures, 'the ear stones' of a fish, and are used to detect acceleration and orientation. They are composed of a combination of protein matrix and calcium carbonate (CaCO 3 ) forming aragonite micro crystals. They have an annually deposited layered conformation with a microstructure corresponding to the seasonal and daily increments. Trace elements, such as Sr, Zn, Fe etc., are also incorporated into the otolith from the environment and the nutrition. The elemental distribution of the otolith of fresh water fish burbot (Lota lota L.) collected in Hungary was measured with Elastic Recoil Detection Analysis (ERDA), Rutherford backscattering spectrometry (RBS) and Particle Induced X-ray Emission (PIXE) at the Nuclear Microprobe Facility of HAS ATOMKI. The spatial 3D structure of the otolith could be observed with a sub-micrometer resolution. It is confirmed that the aragonite micro-crystals are covered by an organic layer and there are some protein rich regions in the otolith, too. By applying the RBSMAST code developed for RBS on macroscopic structure, it was proven that the orientation of the needle shaped aragonite crystals is considerably different at adjacent locations in the otolith. The organic and inorganic component of the otolith could be set apart in the depth selective hydrogen and calcium maps derived by micro- ERDA and micro-RBS. Similar structural analysis could be done near the surface by combining the C, O and Ca elemental maps determined by micro-PIXE measurements. It was observed that the trace metal Zn is bound to the protein component. Acknowledgements This work was partially supported by the Hungarian OTKA Grant No. T046238 and the EU cofunded Economic Competitiveness Operative Programme (GVOP-3.2.1.-2004-04-0402/3.0)

An overview of the facilities, activities, and developments at the University of North Texas Ion Beam Modification and Analysis Laboratory (IBMAL)

Science.gov (United States)

Rout, Bibhudutta; Dhoubhadel, Mangal S.; Poudel, Prakash R.; Kummari, Venkata C.; Pandey, Bimal; Deoli, Naresh T.; Lakshantha, Wickramaarachchige J.; Mulware, Stephen J.; Baxley, Jacob; Manuel, Jack E.; Pacheco, Jose L.; Szilasi, Szabolcs; Weathers, Duncan L.; Reinert, Tilo; Glass, Gary A.; Duggan, Jerry L.; McDaniel, Floyd D.

2013-07-01

The Ion Beam Modification and Analysis Laboratory (IBMAL) at the University of North Texas includes several accelerator facilities with capabilities of producing a variety of ion beams from tens of keV to several MeV in energy. The four accelerators are used for research, graduate and undergraduate education, and industrial applications. The NEC 3MV Pelletron tandem accelerator has three ion sources for negative ions: He Alphatross and two different SNICS-type sputter ion sources. Presently, the tandem accelerator has four high-energy beam transport lines and one low-energy beam transport line directly taken from the negative ion sources for different research experiments. For the low-energy beam line, the ion energy can be varied from ˜20 to 80 keV for ion implantation/modification of materials. The four post-acceleration beam lines include a heavy-ion nuclear microprobe; multi-purpose PIXE, RBS, ERD, NRA, and broad-beam single-event upset; high-energy ion implantation line; and trace-element accelerator mass spectrometry. The NEC 3MV single-ended Pelletron accelerator has an RF ion source mainly for hydrogen, helium and heavier inert gases. We recently installed a capacitive liner to the terminal potential stabilization system for high terminal voltage stability and high-resolution microprobe analysis. The accelerator serves a beam line for standard RBS and RBS/C. Another beamline for high energy focused ion beam application using a magnetic quadrupole lens system is currently under construction. This beam line will also serve for developmental work on an electrostatic lens system. The third accelerator is a 200 kV Cockcroft-Walton accelerator with an RF ion source. The fourth accelerator is a 2.5 MV Van de Graaff accelerator, which was in operation for last several decades is currently planned to be used mainly for educational purpose. Research projects that will be briefly discussed include materials synthesis/modification for photonic, electronic, and

An overview of the facilities, activities, and developments at the University of North Texas Ion Beam Modification and Analysis Laboratory (IBMAL)

Energy Technology Data Exchange (ETDEWEB)

Rout, Bibhudutta; Dhoubhadel, Mangal S.; Poudel, Prakash R.; Kummari, Venkata C.; Pandey, Bimal; Deoli, Naresh T.; Lakshantha, Wickramaarachchige J.; Mulware, Stephen J.; Baxley, Jacob; Manuel, Jack E.; Pacheco, Jose L.; Szilasi, Szabolcs; Weathers, Duncan L.; Reinert, Tilo; Glass, Gary A.; Duggan, Jerry L.; McDaniel, Floyd D. [Ion Beam Modification and Analysis Laboratory, University of North Texas, Department of Physics, 1155 Union Circle 311427, Denton, Texas 76203 (United States)

2013-07-03

The Ion Beam Modification and Analysis Laboratory (IBMAL) at the University of North Texas includes several accelerator facilities with capabilities of producing a variety of ion beams from tens of keV to several MeV in energy. The four accelerators are used for research, graduate and undergraduate education, and industrial applications. The NEC 3MV Pelletron tandem accelerator has three ion sources for negative ions: He Alphatross and two different SNICS-type sputter ion sources. Presently, the tandem accelerator has four high-energy beam transport lines and one low-energy beam transport line directly taken from the negative ion sources for different research experiments. For the low-energy beam line, the ion energy can be varied from {approx}20 to 80 keV for ion implantation/modification of materials. The four post-acceleration beam lines include a heavy-ion nuclear microprobe; multi-purpose PIXE, RBS, ERD, NRA, and broad-beam single-event upset; high-energy ion implantation line; and trace-element accelerator mass spectrometry. The NEC 3MV single-ended Pelletron accelerator has an RF ion source mainly for hydrogen, helium and heavier inert gases. We recently installed a capacitive liner to the terminal potential stabilization system for high terminal voltage stability and high-resolution microprobe analysis. The accelerator serves a beam line for standard RBS and RBS/C. Another beamline for high energy focused ion beam application using a magnetic quadrupole lens system is currently under construction. This beam line will also serve for developmental work on an electrostatic lens system. The third accelerator is a 200 kV Cockcroft-Walton accelerator with an RF ion source. The fourth accelerator is a 2.5 MV Van de Graaff accelerator, which was in operation for last several decades is currently planned to be used mainly for educational purpose. Research projects that will be briefly discussed include materials synthesis/modification for photonic, electronic, and

Advanced ion beam analysis of materials using ion-induced fast electron

Energy Technology Data Exchange (ETDEWEB)

Kudo, Hiroshi; Tanabe, Atsushi; Ishihara, Toyoyuki [Tsukuba Univ., Ibaraki (Japan); and others

1997-03-01

Recent progress in the study of high-energy shadowing effect using ion-induced electron spectroscopy is reported with emphasis on a possibility of determination of local electronic structure in solids, which has been a difficult problem to approach with other experimental techniques. We demonstrate real-space determination of covalent-bond electron distribution in Si crystal. The analysis technique may provide a new field of ion beam analysis of solids. (author)

International meeting on micro- and nanotechnologies with application of ion beams accelerated up to low and medium energies. Abstracts of reports

International Nuclear Information System (INIS)

Romanov, V.A.

2007-01-01

The collection contains abstracts presented on the International meeting Micro- and nanotechnologies with application of ion beams accelerated up to low and medium energies which took place 16-18 October 2007 in Obninsk (Russian Federation). The potentialities of ion implantation for creation of nanostructures is discussed. The accelerator complexes applied for manufacture of nanostructural materials are considered [ru

Low-energy ion beam bombardment effect on the plant-cell-envelope mimetic membrane for DNA transfer

International Nuclear Information System (INIS)

Prakrajang, K.; Sangwijit, K.; Anuntalabhochai, S.; Wanichapichart, P.; Yu, L.D.

2012-01-01

This study is a systematic analysis of the mechanisms involved in ion-beam induced DNA transfer, an important application of ion beam biotechnology. Cellulose membranes were used to mimic the plant cell envelope. Ion beams of argon (Ar) or nitrogen (N) at an energy of 25 keV bombarded the cellulose membranes at fluences ranging from 10 15 to 10 16 ions/cm 2 . The damage to the ion-beam-bombarded membranes was characterized using infrared spectroscopy, a micro tensile test and scanning electron microscopy (SEM). Chain scission was the dominant radiation damage type in the membrane. DNA diffusion across the membrane was significantly increased after ion beam bombardment. The increase in DNA transfer is therefore attributed to chain scission, which increases the permeability by increasing the number of pores in the membrane.

Analysis for extraction and bunching of ion beam from spherical reflex triode

International Nuclear Information System (INIS)

Kawata, Shigeo; Abe, Takashi; Kasuya, Koichi; Niu, Keishiro.

1978-11-01

Since an ion beam is hoped to impinge on a target in a spherically symmetric way for inertial confinement fusion, an analysis is developed here for the intense ion beam which is extracted from a spherical reflex triode. The basic equations are the Poisson equation for the electric potential and the conservation equations of energies for the ion and electron velocities. According to the asymptotic solution, the extracted ion-beam-current density is proportional to the power of 3/2 of the voltage imposed on the triode. This dependence of the current density on the voltage is improved to be the power of 1.6 by the numerical analysis. A special time-dependence of the ion-beam power at the target surface is required for an optimal implosion of the target. Using the bunching theory for the ion beam, we derive numerically an optimal time-dependence of the voltage imposed on the triode. Asymptotic forms are also obtained analytically for the voltage. (author)

Development of nuclear fuel for the future -Development of performance improvement of the cladding by ion beam-

Energy Technology Data Exchange (ETDEWEB)

Choi, Byung Hoh; Jung, Moon Kyoo; Jung, Kee Suk; Kim, Wan; Lee, Jae Hyung; Song, Tae Yung [Korea Atomic Energy Research Institute, Taejon (Korea, Republic of); Han, Jun Kun [Sung Kyoon Kwan Univ., Seoul (Korea, Republic of); Kwon, Hyuk Sang [Korea Advanced Institute of Science and Technology, Taejon (Korea, Republic of)

1995-07-01

In this research we analyzed the state of art related to the surface treatment method of nuclear fuel cladding for the development of the surface treatment technique of nuclear fuel cladding by ion beam while investigating major causes of the leakage of fuel rods. Ion implantation simulation code called TRIM-95 was used to decide basic parameters of ion beams and setup an appropriate process for ion implantation. Performance of the ion beam extraction was measured after adding the needed vacuum and cooling system to the existing gas and metal ion implanters. Target system for the ion implantation of fuel cladding improved and a plasma accelerator was installed on the target chamber of the metal ion implanter. The plasma accelerator is used to produce low energy, high current ion beams. The mechanical and chemical properties of the implanted Zircaloy-4 such as micro hardness, wear resistance, fretting wear, friction coefficient and corrosion resistance was measured under the room temperature and atmosphere. A micro structure and composition analysis of Zircaloy-4 sample was performed before and after the implantation to study the cause of the improvement in the mechanical and chemical characteristics. 94 figs, 11 tabs, 51 refs. (Author).

Direct Measurement of Neutral/Ion Beam Power using Thermocouple Analysis

International Nuclear Information System (INIS)

Day, I.; Gee, S.

2006-01-01

Modern Neutral Beam Injection systems such as those used on JET and MAST routinely use thermocouples embedded close to the surface of beam stopping elements, such as calorimeters and ion dumps, coupled to high speed data acquisition systems to determine beam profile and position from temperature rise data. With the availability of low cost data acquisition and storage systems it is now possible to record data from all thermocouples in a fully instrumented calorimeter or ion dump on 20 ms timescales or better. This sample rate is sufficiently fast to enable the thermocouple data to be used to calculate the incident power density from 1d heat transfer theory. This power density data coupled with appropriate Gaussian fits enables the determination of the 2d beam profile and thus allows an instantaneous and direct measurement of beam power. The theory and methodology required to analyse the fast thermocouple data from the MAST calorimeter and residual ion dump thermocouples is presented and direct measurements of beam power density are demonstrated. The power of desktop computers allows such analysis to be carried out virtually instantaneously. The methods used to automate this analysis are discussed in detail. A code, utilising the theory and methodology, has been developed to allow immediate measurements of beam power on a pulse by pulse basis. The uncertainty in determining the beam power density is shown to be less than 10 %. This power density data is then fitted to a 2d Gaussian beam profile and integrated to establish the total beam power. Results of this automated analysis for the neutral beam and residual ion power of the MAST duopigatron and PINI NBI systems are presented. This technology could be applied to a beam power safety interlock system. The application to a beam shine through protection system for the inner wall of the JET Tokamak is discussed as an example. (author)

Intense beam production of highly charged heavy ions by the superconducting electron cyclotron resonance ion source SECRAL.

Science.gov (United States)

Zhao, H W; Sun, L T; Zhang, X Z; Guo, X H; Cao, Y; Lu, W; Zhang, Z M; Yuan, P; Song, M T; Zhao, H Y; Jin, T; Shang, Y; Zhan, W L; Wei, B W; Xie, D Z

2008-02-01

There has been increasing demand to provide higher beam intensity and high enough beam energy for heavy ion accelerator and some other applications, which has driven electron cyclotron resonance (ECR) ion source to produce higher charge state ions with higher beam intensity. One of development trends for highly charged ECR ion source is to build new generation ECR sources by utilization of superconducting magnet technology. SECRAL (superconducting ECR ion source with advanced design in Lanzhou) was successfully built to produce intense beams of highly charged ion for Heavy Ion Research Facility in Lanzhou (HIRFL). The ion source has been optimized to be operated at 28 GHz for its maximum performance. The superconducting magnet confinement configuration of the ion source consists of three axial solenoid coils and six sextupole coils with a cold iron structure as field booster and clamping. An innovative design of SECRAL is that the three axial solenoid coils are located inside of the sextupole bore in order to reduce the interaction forces between the sextupole coils and the solenoid coils. For 28 GHz operation, the magnet assembly can produce peak mirror fields on axis of 3.6 T at injection, 2.2 T at extraction, and a radial sextupole field of 2.0 T at plasma chamber wall. During the commissioning phase at 18 GHz with a stainless steel chamber, tests with various gases and some metals have been conducted with microwave power less than 3.5 kW by two 18 GHz rf generators. It demonstrates the performance is very promising. Some record ion beam intensities have been produced, for instance, 810 e microA of O(7+), 505 e microA of Xe(20+), 306 e microA of Xe(27+), and so on. The effect of the magnetic field configuration on the ion source performance has been studied experimentally. SECRAL has been put into operation to provide highly charged ion beams for HIRFL facility since May 2007.

Low-energy ion beam bombardment effect on the plant-cell-envelope mimetic membrane for DNA transfer

Energy Technology Data Exchange (ETDEWEB)

Prakrajang, K., E-mail: k.prakrajang@gmail.com [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Sangwijit, K.; Anuntalabhochai, S. [Molecular Biology Laboratory, Department of Biology, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Wanichapichart, P. [Membrane Science and Technology Research Center, Department of Physics, Faculty of Science, Prince of Songkla University, Hat Yai, Songkla 90112 (Thailand); Yu, L.D., E-mail: yuld@fnrf.science.cmu.ac.th [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)

2012-09-01

This study is a systematic analysis of the mechanisms involved in ion-beam induced DNA transfer, an important application of ion beam biotechnology. Cellulose membranes were used to mimic the plant cell envelope. Ion beams of argon (Ar) or nitrogen (N) at an energy of 25 keV bombarded the cellulose membranes at fluences ranging from 10{sup 15} to 10{sup 16} ions/cm{sup 2}. The damage to the ion-beam-bombarded membranes was characterized using infrared spectroscopy, a micro tensile test and scanning electron microscopy (SEM). Chain scission was the dominant radiation damage type in the membrane. DNA diffusion across the membrane was significantly increased after ion beam bombardment. The increase in DNA transfer is therefore attributed to chain scission, which increases the permeability by increasing the number of pores in the membrane.

The generation of high-power charge particle micro beams and its interaction with condensed matter

International Nuclear Information System (INIS)

Vogel, N.; Skvortsov, V.A.

1996-01-01

As has been observed experimentally, the action of a picosecond laser beam on an Al-target in air gives rise to the generation and acceleration of high-power micro electron and ion beams. An original theoretical model for describing the generation and particle acceleration of such micro beams as a result of the micro channeling effect is presented. It was found that extreme states of matter, with compression in the Gbar pressure range, can be produced by such micro beams. (author). 3 figs., 12 refs

In situ MeV ion beam analysis of ceramic surfaces modified by 100-400 keV ion irradiation

International Nuclear Information System (INIS)

Weber, W.J.; Yu, N.; Sickafus, K.E.

1995-05-01

This paper describes use of the in situ ion beam analysis facility developed at Los Alamos National Laboratory for the study of irradiation effects in ceramic materials. In this facility, an analytical beamline of 3 MV tandem accelerator and an irradiation bean-dine of 200 kV ion implanter are connected at 60 degrees to a common target chamber. This facility provides a fast, efficient, and quantitative measurement tool to monitor changes of composition and crystallinity of materials irradiated by 100-400 keV ions, through sequential measurement of backscattering events of MeV ions combined with ion channeling techniques. We will describe the details of the in situ ion beam analysis and ion irradiation and discuss some of the important issues and their solutions associated with the in situ experiment. These issues include (1) the selection of axial ion channeling direction for the measurement of radiation damage; (2) surface charging and charge collection for data acquisition; (3) surface sputtering during ion irradiation; (4) the effects of MeV analytical beam on the materials; and (5) the sample heating effect on ion beam analysis

Ion Beam Materials Analysis and Modifications at keV to MeV Energies at the University of North Texas

Science.gov (United States)

Rout, Bibhudutta; Dhoubhadel, Mangal S.; Poudel, Prakash R.; Kummari, Venkata C.; Lakshantha, Wickramaarachchige J.; Manuel, Jack E.; Bohara, Gyanendra; Szilasi, Szabolcs Z.; Glass, Gary A.; McDaniel, Floyd D.

2014-02-01

The University of North Texas (UNT) Ion Beam Modification and Analysis Laboratory (IBMAL) has four particle accelerators including a National Electrostatics Corporation (NEC) 9SDH-2 3 MV tandem Pelletron, a NEC 9SH 3 MV single-ended Pelletron, and a 200 kV Cockcroft-Walton. A fourth HVEC AK 2.5 MV Van de Graaff accelerator is presently being refurbished as an educational training facility. These accelerators can produce and accelerate almost any ion in the periodic table at energies from a few keV to tens of MeV. They are used to modify materials by ion implantation and to analyze materials by numerous atomic and nuclear physics techniques. The NEC 9SH accelerator was recently installed in the IBMAL and subsequently upgraded with the addition of a capacitive-liner and terminal potential stabilization system to reduce ion energy spread and therefore improve spatial resolution of the probing ion beam to hundreds of nanometers. Research involves materials modification and synthesis by ion implantation for photonic, electronic, and magnetic applications, micro-fabrication by high energy (MeV) ion beam lithography, microanalysis of biomedical and semiconductor materials, development of highenergy ion nanoprobe focusing systems, and educational and outreach activities. An overview of the IBMAL facilities and some of the current research projects are discussed.

Advancements in ion beam figuring of very thin glass plates (Conference Presentation)

Science.gov (United States)

Civitani, M.; Ghigo, M.; Hołyszko, J.; Vecchi, G.; Basso, S.; Cotroneo, V.; DeRoo, C. T.; Schwartz, E. D.; Reid, P. B.

2017-09-01

The high-quality surface characteristics, both in terms of figure error and of micro-roughness, required on the mirrors of a high angular resolution x-ray telescope are challenging, but in principle well suited with a deterministic and non-contact process like the ion beam figuring. This process has been recently proven to be compatible even with very thin (thickness around 0.4mm) sheet of glasses (like D263 and Eagle). In the last decade, these types of glass have been investigated as substrates for hot slumping, with residual figure errors of hundreds of nanometres. In this view, the mirrors segments fabrication could be envisaged as a simple two phases process: a first replica step based on hot slumping (direct/indirect) followed by an ion beam figuring which can be considered as a post-fabrication correction method. The first ion beam figuring trials, realized on flat samples, showed that the micro-roughness is not damaged but a deeper analysis is necessary to characterize and eventually control/compensate the glass shape variations. In this paper, we present the advancements in the process definition, both on flat and slumped glass samples.

Physics of gas breakdown for ion beam transport in gas

International Nuclear Information System (INIS)

Olson, C.L.; Poukey, J.W.; Hinshelwood, D.D.; Rose, D.V.; Hubbard, R.F.; Lampe, M.; Neri, J.M.; Ottinger, P.F.; Slinker, S.P.; Stephanakis, S.J.; Young, F.C.; Welch, D.R.

1993-01-01

Detailed analysis, experiments, and computer simulations are producing a new understanding of gas breakdown during intense ion beam transport in neutral gas. Charge neutralization of beam micro clumps is shown to limit the net clump potentials to a non-zero value π min , which can lead to divergence growth and axial energy spreading. At pressures approx-gt 1 Torr, plasma shielding should substantially reduce this effect Current neutralization has been studied in experiments on the GAMBLE II accelerator. The importance of fast electrons (knockons and runaways) has been established in IPROP simulations, which are in agreement with the experiments. For light ion fusion parameters with pressures approx-gt 1 Torr, very small net current fractions (much-lt 1%) appear feasible, permitting ballistic transport in gas. Self-pinched requires higher net current fractions (≥ 2%) and preliminary IPROP code results indicate that this appears achievable for small-radius intense beams in lower pressure gases (approx-gt Torr). Several self-pinched transport concepts look promising. The importance of these results for both light ion fusion and heavy ion fusion is discussed

Bayesian analysis of ion beam diagnostics

International Nuclear Information System (INIS)

Toussaint, U. von; Fischer, R.; Dose, V.

2001-01-01

Ion beam diagnostics are routinely used for quantitative analysis of the surface composition of mixture materials up to a depth of a few μm. Unfortunately, advantageous properties of the diagnostics, like high depth resolution in combination with a large penetration depth, no destruction of the surface, high sensitivity for large as well as for small atomic numbers, and high sensitivity are mutually exclusive. Among other things, this is due to the ill-conditioned inverse problem of reconstructing depth distributions of the composition elements. Robust results for depth distributions are obtained with adaptive methods in the framework of Bayesian probability theory. The method of adaptive kernels allows for distributions which contain only the significant information of the data while noise fitting is avoided. This is achieved by adaptively reducing the degrees of freedom supporting the distribution. As applications for ion beam diagnostics Rutherford backscattering spectroscopy and particle induced X-ray emission are shown

Characterization of an ion beam produced by extraction and acceleration of ions from a wire plasma source

International Nuclear Information System (INIS)

Gueroult, R.

2011-09-01

In this study we first model a DC low pressure wire plasma source and then characterize the properties of an ion gun derived from the plasma source. In order to study the properties of the derived ion gun, we develop a particle-in-cell code fitted to the modelling of the wire plasma source operation, and validate it by confrontation with the results of an experimental study. In light of the simulation results, an analysis of the wire discharge in terms of a collisional Child-Langmuir ion flow in cylindrical geometry is proposed. We interpret the mode transition as a natural reorganization of the discharge when the current is increased above a threshold value which is a function of the discharge voltage, the pressure and the inter-electrodes distance. In addition, the analysis of the energy distribution function of ions impacting the cathode demonstrates the ability to extract an ion beam of low energy spread around the discharge voltage assuming that the discharge is operated in its high pressure mode. An ion source prototype allowing the extraction and acceleration of ions from the wire source is then proposed. The experimental study of such a device confirms that, apart from a shift corresponding to the accelerating voltage, the acceleration scheme does not spread the ion velocity distribution function along the axis of the beam. It is therefore possible to produce tunable energy (0 - 5 keV) ion beams of various ionic species presenting limited energy dispersion (∼ 10 eV). The typical beam currents are about a few tens of micro-amperes, and the divergence of such a beam is on the order of one degree. A numerical modelling of the ion source is eventually conducted in order to identify potential optimizations of the concept. (author)

New lens system using toroidal magnetic field for intense ion beam

International Nuclear Information System (INIS)

Mohri, Akihiro; Ikuta, Kazunari; Fujita, Junji.

1976-11-01

The use of toroidal magnetic field as a lens system is proposed for producing intense ion beam. The characteristics of the lens system are obtained both analytically and numerically. Some examples of ray-trajectories are presented for different focal lengths. The system is applicable to neutral beam injection heating and micro-pellet implosion for nuclear fusion, and to the other fields such as ion beam X-ray lasers. (auth.)

Ion-beam mixing of ceramic alloys: preparation and mechanical properties

International Nuclear Information System (INIS)

Lewis, M.B.; McHargue, C.J.

1981-01-01

Techniques used to produce unique states of pure metals mixed into ceramic materials are presented. The samples were prepared by irradiating a 1-MeV Fe + beam on Al 2 O 3 crystal surfaces over which a thin chromium or zirconium film had been evaporated. The limitations of using noble gas ion beams are noted. Micro Knoop hardness tests performed near the surfaces of the samples indicated a significant increase in the hardness of most samples prepared by ion beam mixing

Ion beam analysis of ground coffee and roasted coffee beans

International Nuclear Information System (INIS)

Debastiani, R.; Santos, C.E.I. dos; Yoneama, M.L.; Amaral, L.; Dias, J.F.

2014-01-01

The way that coffee is prepared (using roasted ground coffee or roasted coffee beans) may influence the quality of beverage. Therefore, the aim of this work is to use ion beam techniques to perform a full elemental analysis of packed roasted ground coffee and packed roasted coffee beans, as well as green coffee beans. The samples were analyzed by PIXE (particle-induced X-ray emission). Light elements were measured through RBS (Rutherford backscattering spectrometry) experiments. Micro-PIXE experiments were carried out in order to check the elemental distribution in the roasted and green coffee beans. In general, the elements found in ground coffee were Mg, P, S, Cl, K, Ca, Ti, Mn, Fe, Cu, Zn, Rb and Sr. A comparison between ground coffee and grinded roasted beans shows significant differences for several elements. Elemental maps reveal that P and K are correlated and practically homogeneously distributed over the beans

Ion beam analysis of ground coffee and roasted coffee beans

Energy Technology Data Exchange (ETDEWEB)

Debastiani, R., E-mail: rafa_debas@yahoo.com.br; Santos, C.E.I. dos; Yoneama, M.L.; Amaral, L.; Dias, J.F.

2014-01-01

The way that coffee is prepared (using roasted ground coffee or roasted coffee beans) may influence the quality of beverage. Therefore, the aim of this work is to use ion beam techniques to perform a full elemental analysis of packed roasted ground coffee and packed roasted coffee beans, as well as green coffee beans. The samples were analyzed by PIXE (particle-induced X-ray emission). Light elements were measured through RBS (Rutherford backscattering spectrometry) experiments. Micro-PIXE experiments were carried out in order to check the elemental distribution in the roasted and green coffee beans. In general, the elements found in ground coffee were Mg, P, S, Cl, K, Ca, Ti, Mn, Fe, Cu, Zn, Rb and Sr. A comparison between ground coffee and grinded roasted beans shows significant differences for several elements. Elemental maps reveal that P and K are correlated and practically homogeneously distributed over the beans.

Study of tapered glass capillary focusing MeV ion beam

International Nuclear Information System (INIS)

Gong Zhiyu; Yan Sha; Ma Hongji; Nie Rui; Xue Jianming; Wang Yugang

2012-01-01

In recent years, tapered glass capillary ion beam focusing is developing rapidly. It is attractive for simple, compact, low cost and easy use. However, the focusing mechanism for MeV ion beams is still indistinct. We present several experimental results of focusing 2 MeV He + beam. Ion beams were focused by tapered glass capillaries with various outlet inner diameters from several micron to hundred micron. The current densities, angle divergences and energy spectra of the transmitted ion beams are measured. The results proved that 2 MeV He + ions can focused and guided by our capillaries. The energy spectra show that a great part of transmitted ions experienced obvious energy loss, which is different from results of others research groups. We discussed the reason and charged it to the larger incident angle. Considered the incident ions with larger incident angle, the charge will distribute in a layer of micro meter depth in the capillary’s inner wall, but not the surface. The energy loss and many other spectra characters can be explained in this way.

Experimental study of the transport limits of intense heavy ion beams in the HCX

International Nuclear Information System (INIS)

Prost, L.R.; Bieniosek, F.M.; Celata, C.M.; Dugan, C.C.; Faltens, A.; Seidl, P.A.; Waldron, W.L.; Cohen, R.; Friedman, A.; Kireeff Covo, M.; Lund, S.M.; Molvik, A.W.; Haber, I.

2004-01-01

The High Current Experiment (HCX) at Lawrence Berkeley National Laboratory is part of the US program to explore heavy-ion beam transport at a scale representative of the low-energy end of an induction linac driver for fusion energy production. The primary mission of this experiment is to investigate aperture fill factors acceptable for the transport of space-charge-dominated heavy-ion beams at high space-charge intensity (line charge density up to ∼ 0.2 (micro)C/m) over long pulse durations (4 (micro)s) in alternating gradient focusing lattices of electrostatic or magnetic quadrupoles. The experiment also contributes to the practical baseline knowledge of intense beam manipulations necessary for the design, construction and operation of a heavy ion driver for inertial fusion. This experiment is testing transport issues resulting from nonlinear space-charge effects and collective modes, beam centroid alignment and beam steering, matching, image charges, halo, electron cloud effects, and longitudinal bunch control. We first present the results for a coasting 1 MeV K + ion beam transported through the first ten electrostatic transport quadrupoles, measured with optical beam-imaging and double-slit phase-space diagnostics. This includes studies at two different radial fill factors (60% and 80%), for which the beam transverse distribution was characterized in detail. Additionally, beam energy measurements will be shown. We then discuss the first results of beam transport through four pulsed room-temperature magnetic quadrupoles (located downstream of the electrostatic quadrupoles), where the beam dynamics become more sensitive to the presence of secondary electrons

Ion-beam plasma and propagation of intense compensated ion beams

Energy Technology Data Exchange (ETDEWEB)

Gabovich, M D [AN Ukrainskoj SSR, Kiev. Inst. Fiziki

1977-02-01

Discussed are the results of investigation of plasma properties received by neutralization of intense ion beam space charge. Considered is the process of ion beam compensation by charges, formed as a result of gas ionization by this beam or by externally introduced ones. Emphasis is placed on collective phenomena in ion-beam plasma, in particular on non-linear effects limiting amplitude of oscillations. It is shown that not only dynamic decompensation but the Coulomb collisions of ions with electrons as well as other collective oscillations significantly affects the propagation of compensated ion beams. All the processes are to be taken into account in solving the problem of obtaining ''superdense'' compensated beams.

Ion-beam plasma and propagation of intense compensated ion beams

International Nuclear Information System (INIS)

Gabovich, M.D.

1977-01-01

Discussed are the results of investigation of plasma properties recieved by neutralization of intensive ion beam space charge. Considered is the process of ion beam compensation by charges, formed as a result of gas ionization by this beam or by externally introduced ones. Emphasis is placed on collective phenomena in ion-beam plasma, in particular on non-linear effects limiting amplitude of oscillations. It is shown, that not only dinamic decompensation but the Coulomb collisions of ions with electrons as well as other collective oscillations significantly affects the propagation of compensated ion beams. All the processes are to be taken into account at solving the problem of obtaining ''superdense'' compensated beams

Study of crystal damage by ion implantation using micro RBS/channeling

International Nuclear Information System (INIS)

Grambole, D.; Herrmann, F.; Heera, V.; Meijer, J.

2007-01-01

The combination of microbeam implantation and in-situ micro RBS/channeling analysis in the Rossendorf nuclear microprobe facility enables crystal damage studies with high current densities not achievable in standard ion implantation experiments. Si(1 0 0) samples were implanted with 600 keV Si + ions and a fluence of 1 x 10 16 cm -2 . Using a beam spot of 200 μm x 200 μm current densities from 4 to 120 μA/cm 2 were obtained. The substrate temperature was varied between RT and 265 deg. C. The implanted regions were subsequently analysed by micro RBS/channeling with a 3 MeV He + beam having a spot size of 50 μm x 50 μm. Crystal damage up to amorphisation was observed in dependence on the substrate temperature. Above a critical temperature T C no amorphisation occurs. T C was determined for each series of samples implanted with the same ion current density j. It was found that the empirical Arrhenius relation j ∼ exp(-E a /kT C ), known from standard implantation experiments, is also valid at high current densities. The observed Arrhenius law can be derived from a model of epitaxial crystallisation stimulated by defect diffusion

A study of small molecule ingress into planar and cylindrical materials using ion beam analysis

International Nuclear Information System (INIS)

Smith, R.W.

2001-12-01

Ion beam analysis techniques have been developed to allow profiling of small molecules diffused into materials at depths ranging from 10 -7 to 10 -1 m. A model DPS/PS/DPS triple-layer film and D( 3 He,p) 4 He nuclear reaction analysis was used to test the applicability of a novel data processing program - the IBA DataFurnace - to nuclear reaction data. The same reaction and program were used to depth profile the diffusion of heavy water into cellophane. A scanning 3 He micro-beam technique was developed to profile the diffusion of small molecules into both planar and cylindrical materials. The materials were exposed to liquids containing deuterium labelled molecules. A cross-section was exposed by cutting the material perpendicular to the surface and this was bombarded by a scanning 3 He micro-beam. Nuclear reaction analysis was used to profile the diffusing molecules, particle induced X-ray emission (in most cases) to locate the matrix and Rutherford backscattering for normalisation. Two-dimensional maps showing the molecular distribution over the cross-section were obtained. From these one-dimensional concentration profiles were produced. Water diffusion was studied into a planar and a cylindrical polymer, three different planar fibre optic grade glasses and both a fibre optic pressure sensor and communication fibre. The diffusion of dye into hair was also investigated. These studies have provided information about the diffusion mechanisms that take place, and where relevant diffusion coefficients have been obtained using either a semi-infinite medium Fickian planar diffusion model or a cylindrical Fickian diffusion model. (author)

Ion beam monitoring

International Nuclear Information System (INIS)

McKinney, C.R.

1980-01-01

An ion beam analyzer is specified, having an ion source for generating ions of a sample to be analyzed, means for extracting the sample ions, means for focusing the sample ions into a beam, separation means positioned along the ion beam for selectively deflecting species of ions, and means for detecting the selected species of ions. According to the specification, the analyzer further comprises (a) means for disabling at least a portion of the separation means, such that the ion beam from the source remains undeflected; (b) means located along the path of the undeflected ion beam for sensing the sample ions; and (c) enabling means responsive to the sensing means for automatically re-enabling the separation means when the sample ions reach a predetermined intensity level. (author)

Photonic guiding structures in lithium niobate crystals produced by energetic ion beams

Science.gov (United States)

Chen, Feng

2009-10-01

A range of ion beam techniques have been used to fabricate a variety of photonic guiding structures in the well-known lithium niobate (LiNbO3 or LN) crystals that are of great importance in integrated photonics/optics. This paper reviews the up-to-date research progress of ion-beam-processed LiNbO3 photonic structures and reports on their fabrication, characterization, and applications. Ion beams are being used with this material in a wide range of techniques, as exemplified by the following examples. Ion beam milling/etching can remove the selected surface regions of LiNbO3 crystals via the sputtering effects. Ion implantation and swift ion irradiation can form optical waveguide structures by modifying the surface refractive indices of the LiNbO3 wafers. Crystal ion slicing has been used to obtain bulk-quality LiNbO3 single-crystalline thin films or membranes by exfoliating the implanted layer from the original substrate. Focused ion beams can either generate small structures of micron or submicron dimensions, to realize photonic bandgap crystals in LiNbO3, or directly write surface waveguides or other guiding devices in the crystal. Ion beam-enhanced etching has been extensively applied for micro- or nanostructuring of LiNbO3 surfaces. Methods developed to fabricate a range of photonic guiding structures in LiNbO3 are introduced. Modifications of LiNbO3 through the use of various energetic ion beams, including changes in refractive index and properties related to the photonic guiding structures as well as to the materials (i.e., electro-optic, nonlinear optic, luminescent, and photorefractive features), are overviewed in detail. The application of these LiNbO3 photonic guiding structures in both micro- and nanophotonics are briefly summarized.

Compositional analysis of YBaCuO superconducting films with ion beam analysis techniques

International Nuclear Information System (INIS)

Jones, S.; Timmers, H.; Ophel, T.R.; Elliman, R.G.

1999-01-01

High-T c YBa x Cu y O 7-δ superconducting films are being developed for applications such as superconducting quantum interference devices. The carrier concentration, critical current density J c and critical temperature T c of these films depend sensitively on the oxygen content . Stoichiometry, uniformity with depth, homogeneity across the sample and film thickness are also important quantities for their characterisation. It has been shown, for example, that the stoichiometry of the metallic elements affects the growth characteristics and surface morphology of the films. With the deposit ion techniques used, reproducibility of film properties is difficult. The characterisation of YBa x Cu y O 7-δ films with ion beam analysis techniques is complex. Whereas the three metallic elements can be detected with helium beams and Rutherford Backscattering (RBS), the oxygen signal is generally obscured by that from substrate elements. It can be better detected using resonant backscattering with 3.04MeV 4 He ions or nuclear reaction analysis. Elastic Recoil Detection (ERD) with high-energetic (1MeV/amu), heavy beams (Z > 120), enables all elements to be detected and separated in a single experiment. It is well established that ion bombardment induces vacancies in the oxygen sub-lattice, driving the material to change from crystalline to amorphous, the latter phase having a reduced oxygen content. In previous heavy ion ERD measurements of YBa x Cu yO z films with 200MeV 127 I beams, the opaque films became transparent in the beam spot area, indicative of the amorphous phase. The accuracy of the oxygen measurement is therefore questionable. Indeed, using Raman spectroscopy, distortions of the crystalline structure above a fluence of 5 x 10 11 ion/cm 2 and for higher doses some signatures of a reduction in oxygen content have been observed for such beams. It appears therefore that a correct determination of the oxygen content requires either a drastic reduction in fluence or a

Beam-envelope calculations of space-charge loaded beams in MeV dc ion-implantation facilities

International Nuclear Information System (INIS)

Urbanus, W.H.; Bannenberg, J.G.; Doorn, S.; Saris, F.W.; Koudijs, R.; Dubbelman, P.; Koelewijn, W.

1989-01-01

MeV dc ion accelerators are being developed that can deliver a beam current up to several hundred micro-amperes. At the low-energy part of the accelerator, the beam transport is space-charge dominated rather than emittance dominated. A system of differential equations has been derived, based on the Kapchinski-Vladimirski equations, which describe the envelope of a space-charge loaded ion beam, taking a longitudinal electrical field in an accelerating tube into account. The equations have been used to design the accelerator of a high-current 1 MV heavy-ion implantation facility. Furthermore, the design of a 2 MV accelerator is presented, which is used for analyzing techniques such as RBS and PIXE. Both facilities are based on single-ended Van de Graaff accelerators. (orig.)

Ion beam techniques for analyzing polymers irradiated by ions

International Nuclear Information System (INIS)

Rickards, J.; Zironi, E.P.; Andrade, E.; Dominguez, B.

1992-01-01

In the study of the effects of ion beam irradiation of polymers very large doses can be administered in short times. Thousands of MGy can be produced in a small volume of a sample in a few minutes by bombarding with typical ion beam currents. For instance, in an experiment done to observe the effects of 750 keV proton irradiation PVC, using a collimator of 1 mm diameter, 1 μC of charge integration deposits a dose of 50 MGy. The use of ion beams also opens up the possibility of using the same beam for irradiation and for analysis of the effects, using the well known ion beam analysis techniques. PIXE allows the measurement of chlorine in PVC. Polymers containing fluorine can be measured with the resonant nuclear reaction (RNR) technique, which is specific only to certain elements. The amount of hydrogen in the sample and its profile can be obtained using energy recoil detection analysis (ERDA); carbon, oxygen, and nitrogen can be measured and profiled using Rutherford backscattering (RBS) and also using the (d,p) and (d, α) nuclear reactions (NR). Loss of mass is one effect that can be studied using these techniques. It was studied in two different polymers, PVC and CR-39, in order to determine carbon buildup during ion irradiation. It was concluded that carbon builds up following different mechanisms in these two materials, due to the different possibilities of forming volatile compounds. It is also suggested that CR-39 should be a good material for ion beam lithography. (author)

Scanning transmission ion micro-tomography (STIM-T) of biological specimens

International Nuclear Information System (INIS)

Schwertner, Michael; Sakellariou, Arthur; Reinert, Tilo; Butz, Tilman

2006-01-01

Computed tomography (CT) was applied to sets of Scanning Transmission Ion Microscopy (STIM) projections recorded at the LIPSION ion beam laboratory (Leipzig) in order to visualize the 3D-mass distribution in several specimens. Examples for a test structure (copper grid) and for biological specimens (cartilage cells, cygospore) are shown. Scanning Transmission Micro-Tomography (STIM-T) at a resolution of 260 nm was demonstrated for the first time. Sub-micron features of the Cu-grid specimen were verified by scanning electron microscopy. The ion energy loss measured during a STIM-T experiment is related to the mass density of the specimen. Typically, biological specimens can be analysed without staining. Only shock freezing and freeze-drying is required to preserve the ultra-structure of the specimen. The radiation damage to the specimen during the experiment can be neglected. This is an advantage compared to other techniques like X-ray micro-tomography. At present, the spatial resolution is limited by beam position fluctuations and specimen vibrations

Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy?

Energy Technology Data Exchange (ETDEWEB)

Janssens, K.; Adams, F. [Universitaire Instelling Antwerpen, Antwerp (Belgium). Dept. of Chemistry; Rivers, M.L.; Jones, K.W. [Brookhaven National Lab., Upton, NY (United States)

1992-10-01

Synchrotron Radiation induced X-ray micro Fluorescence analysis ({mu}-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.

Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy

Energy Technology Data Exchange (ETDEWEB)

Janssens, K.; Adams, F. (Universitaire Instelling Antwerpen, Antwerp (Belgium). Dept. of Chemistry); Rivers, M.L.; Jones, K.W. (Brookhaven National Lab., Upton, NY (United States))

1992-01-01

Synchrotron Radiation induced X-ray micro Fluorescence analysis ([mu]-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.

Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy?

International Nuclear Information System (INIS)

Janssens, K.; Adams, F.

1992-01-01

Synchrotron Radiation induced X-ray micro Fluorescence analysis (μ-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed

MultiSIMNRA: A computational tool for self-consistent ion beam analysis using SIMNRA

International Nuclear Information System (INIS)

Silva, T.F.; Rodrigues, C.L.; Mayer, M.; Moro, M.V.; Trindade, G.F.; Aguirre, F.R.; Added, N.; Rizzutto, M.A.; Tabacniks, M.H.

2016-01-01

Highlights: • MultiSIMNRA enables the self-consistent analysis of multiple ion beam techniques. • Self-consistent analysis enables unequivocal and reliable modeling of the sample. • Four different computational algorithms available for model optimizations. • Definition of constraints enables to include prior knowledge into the analysis. - Abstract: SIMNRA is widely adopted by the scientific community of ion beam analysis for the simulation and interpretation of nuclear scattering techniques for material characterization. Taking advantage of its recognized reliability and quality of the simulations, we developed a computer program that uses multiple parallel sessions of SIMNRA to perform self-consistent analysis of data obtained by different ion beam techniques or in different experimental conditions of a given sample. In this paper, we present a result using MultiSIMNRA for a self-consistent multi-elemental analysis of a thin film produced by magnetron sputtering. The results demonstrate the potentialities of the self-consistent analysis and its feasibility using MultiSIMNRA.

The application of ion beams to corrosion science

International Nuclear Information System (INIS)

Ashworth, V.; Grant, W.A.; Proctor, R.P.M.

1976-01-01

Briefly, the paper provides some basic information on the use of ion beams for surface alloying and surface analysis. After a brief historical review of those fields in which the techniques are already widely applied the important features of typical ion beam machines are described. The basic processes that occur when an ion beam strikes a solid are then considered. Selected ion beam analysis techniques are then discussed. Attention is drawn, wherever possible, to applications in corrosion science and engineering. (author)

Ion diode optics: measurement of divergence and aiming of beams for transport to light-ion ICF targets

International Nuclear Information System (INIS)

Krastelev, E.G.; Kniazev, B.A.; Lindholm, F.; Hammer, D.A.; Kusse, B.R.; Greenly, J.B.

1996-01-01

Diagnostic development for measurements of anode plasma structure and ion beam local aiming and micro-divergence are being developed on the COBRA accelerator at Cornell University. Results of streaked-scintillator and tracer target beam diagnostics, and streaked anode light imaging are described. (author). 5 figs., 1 ref

Ion diode optics: measurement of divergence and aiming of beams for transport to light-ion ICF targets

Energy Technology Data Exchange (ETDEWEB)

Krastelev, E G; Kniazev, B A; Lindholm, F; Hammer, D A; Kusse, B R; Greenly, J B [Cornell Univ., Ithaca, NY (United States). Lab. of Plasma Studies

1997-12-31

Diagnostic development for measurements of anode plasma structure and ion beam local aiming and micro-divergence are being developed on the COBRA accelerator at Cornell University. Results of streaked-scintillator and tracer target beam diagnostics, and streaked anode light imaging are described. (author). 5 figs., 1 ref.

MeV ion-beam analysis of optical data storage films

Science.gov (United States)

Leavitt, J. A.; Mcintyre, L. C., Jr.; Lin, Z.

1993-01-01

Our objectives are threefold: (1) to accurately characterize optical data storage films by MeV ion-beam analysis (IBA) for ODSC collaborators; (2) to develop new and/or improved analysis techniques; and (3) to expand the capabilities of the IBA facility itself. Using H-1(+), He-4(+), and N-15(++) ion beams in the 1.5 MeV to 10 MeV energy range from a 5.5 MV Van de Graaff accelerator, film thickness (in atoms/sq cm), stoichiometry, impurity concentration profiles, and crystalline structure were determined by Rutherford backscattering (RBS), high-energy backscattering, channeling, nuclear reaction analysis (NRA) and proton induced X-ray emission (PIXE). Most of these techniques are discussed in detail in the ODSC Annual Report (February 17, 1987), p. 74. The PIXE technique is briefly discussed in the ODSC Annual Report (March 15, 1991), p. 23.

Light-ion beam for microelectronic applications

International Nuclear Information System (INIS)

Hirsch, L.; Tardy, P.; Wantz, G.; Huby, N.; Moretto, P.; Serani, L.; Natali, F.; Damilano, B.; Duboz, J.Y.; Reverchon, J.L.

2005-01-01

In this paper we describe the structure and the composition of (Al,Ga)N/GaN Bragg reflectors obtained from Rutherford backscattering spectroscopy. Bragg reflectors constitute a part of blue (λ = 450 nm) resonant cavity light emitting diodes. To improve the measurement accuracy, three tilt angles have been used (10 deg. , 25 deg. and 50 deg. ). In a second part of the paper, ion beam induced charges study has been carried out, with a 2 MeV 4 He + micro-beam, on metal-semiconductor-metal UV photodetectors. Results have been taken into account for the design of the photodetector electrodes

Ion beam analysis techniques applied to large scale pollution studies

Energy Technology Data Exchange (ETDEWEB)

Cohen, D D; Bailey, G; Martin, J; Garton, D; Noorman, H; Stelcer, E; Johnson, P [Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW (Australia)

1994-12-31

Ion Beam Analysis (IBA) techniques are ideally suited to analyse the thousands of filter papers a year that may originate from a large scale aerosol sampling network. They are fast multi-elemental and, for the most part, non-destructive so other analytical methods such as neutron activation and ion chromatography can be performed afterwards. ANSTO in collaboration with the NSW EPA, Pacific Power and the Universities of NSW and Macquarie has established a large area fine aerosol sampling network covering nearly 80,000 square kilometres of NSW with 25 fine particle samplers. This network known as ASP was funded by the Energy Research and Development Corporation (ERDC) and commenced sampling on 1 July 1991. The cyclone sampler at each site has a 2.5 {mu}m particle diameter cut off and runs for 24 hours every Sunday and Wednesday using one Gillman 25mm diameter stretched Teflon filter for each day. These filters are ideal targets for ion beam analysis work. Currently ANSTO receives 300 filters per month from this network for analysis using its accelerator based ion beam techniques on the 3 MV Van de Graaff accelerator. One week a month of accelerator time is dedicated to this analysis. Four simultaneous accelerator based IBA techniques are used at ANSTO, to analyse for the following 24 elements: H, C, N, O, F, Na, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Cu, Ni, Co, Zn, Br and Pb. The IBA techniques were proved invaluable in identifying sources of fine particles and their spatial and seasonal variations accross the large area sampled by the ASP network. 3 figs.

Ion beam analysis techniques applied to large scale pollution studies

Energy Technology Data Exchange (ETDEWEB)

Cohen, D.D.; Bailey, G.; Martin, J.; Garton, D.; Noorman, H.; Stelcer, E.; Johnson, P. [Australian Nuclear Science and Technology Organisation, Lucas Heights, NSW (Australia)

1993-12-31

Ion Beam Analysis (IBA) techniques are ideally suited to analyse the thousands of filter papers a year that may originate from a large scale aerosol sampling network. They are fast multi-elemental and, for the most part, non-destructive so other analytical methods such as neutron activation and ion chromatography can be performed afterwards. ANSTO in collaboration with the NSW EPA, Pacific Power and the Universities of NSW and Macquarie has established a large area fine aerosol sampling network covering nearly 80,000 square kilometres of NSW with 25 fine particle samplers. This network known as ASP was funded by the Energy Research and Development Corporation (ERDC) and commenced sampling on 1 July 1991. The cyclone sampler at each site has a 2.5 {mu}m particle diameter cut off and runs for 24 hours every Sunday and Wednesday using one Gillman 25mm diameter stretched Teflon filter for each day. These filters are ideal targets for ion beam analysis work. Currently ANSTO receives 300 filters per month from this network for analysis using its accelerator based ion beam techniques on the 3 MV Van de Graaff accelerator. One week a month of accelerator time is dedicated to this analysis. Four simultaneous accelerator based IBA techniques are used at ANSTO, to analyse for the following 24 elements: H, C, N, O, F, Na, Al, Si, P, S, Cl, K, Ca, Ti, V, Cr, Mn, Fe, Cu, Ni, Co, Zn, Br and Pb. The IBA techniques were proved invaluable in identifying sources of fine particles and their spatial and seasonal variations accross the large area sampled by the ASP network. 3 figs.

Air Quality Monitoring with Routine Utilization of Ion Beam Analysis

International Nuclear Information System (INIS)

Wegrzynek, D.

2013-01-01

Full text: Information on source contributions to ambient air particulate concentrations is a vital tool for air quality management. Traditional gravimetric analysis of airborne particulate matter is unable to provide information on the sources contributing to air particulate concentrations. Ion beam analysis is used to identify the elemental composition of air particulates for source apportionment and determining the relative contribution of biogenic and anthropogenic sources to air particulate pollution. The elemental composition is obtained by proton induced X-ray emission technique (PIXE), which is an ion beam analysis (IBA) technique. The element concentrations are deduced from the X ray spectra produced when the particulate collected on a filter is bombarded with a high-energy proton beam. As part of the UNDP/IAEA/RCA Project RAS/8/082 ‘Better Management of the Environment, Natural Resources and Industrial Growth through Isotope and Radiation Technology,’ a collaborative alliance was formed between the Institute of Geological and Nuclear Sciences Limited and the Wellington Regional Council, New Zeland [1]. The purpose of the project was to examine the elemental composition of air particulate matter and determine the origins through source apportionment techniques. In New Zealand PM 10 and PM 2.5 fractions have been collected at the industrial area of Seaview, Wellington over two years using a GENT stacked filter unit sampler. Concentrations of elements with atomic mass above neon were determined using ion beam analysis and elemental carbon concentrations were determined using a reflectometer. Specific ambient source elemental 'fingerprints' were then determined by factor analysis and the relative contributions of various local and regional sources were assessed. The significant factors (sources) were determined to be sea salt, soil, industry, and combustion sources. Local industry was found to contribute to ambient lead concentrations. (author)

ERDA with an external helium ion micro-beam: Advantages and potential applications

International Nuclear Information System (INIS)

Calligaro, T.; Castaing, J.; Dran, J.-C.; Moignard, B.; Pivin, J.-C.; Prasad, G.V.R.; Salomon, J.; Walter, P.

2001-01-01

Preliminary ERDA experiments at atmospheric pressure have been performed with our external microprobe set-up currently used for the analysis of museum objects by PIXE, RBS and NRA. The objective was to check the feasibility of hydrogen (and deuterium) profiling with an external beam of 3-MeV helium ions. The standard scattering geometry (incident beam at 15 deg. with respect to sample surface and emerging protons or deuterons at 15 deg. in the forward direction) was kept, but the thin foil absorber was replaced by helium gas filling the space between the beam spot and the detector over a distance of about 84 mm. Several standards prepared by ion implantation, with well known H or D depth profiles, were first analysed, which indicated that the analytical capability was as good as under vacuum. A striking feature is the much lower surface peak than under vacuum, a fact that enhances the sensitivity for H analysis near the surface. The same type of measurement was then performed on different materials to show the usefulness of the technique. As a first example, we have checked that the incorporation of H or D into sapphire crystals during mechanical polishing is below the detection limit. Another example is the measurement of the H content in emeralds which can be used as an additional compositional criterion for determining the provenance of emeralds set in museum jewels. The advantages and limitations of our set-up are discussed and several possible applications in the field of cultural heritage are described

Teeth characterization using ion beam analysis

International Nuclear Information System (INIS)

Rizzutto, M.A.; Added, N.; Tabacniks, M.H.; Falla-Sotelo, F.; Curado, J.F.; Francci, C.; Markarian, R.A.; Quinelato, A.; Youssef, F.; Mori, M.; Youssef, M.

2006-01-01

A collaboration project between the School of Dentistry and the Institute of Physics of the University of Sao Paulo has been established to measure elemental concentrations in teeth by proton induced X-ray emission (PIXE) and heavy ion elastic recoil detection analysis (HI-ERDA) techniques. Data on trace elements in human, bovine and swine teeth, analyzed by PIXE with a 2.4 MeV proton beam, were compared and concentrations for several elements were obtained with tens of μg/g sensitivity. HI-ERDA measurements employing a 52 MeV Cl beam were done to evaluate changes in elementary concentration in dental enamel after bleaching treatment with different products in 25 bovine incisors teeth. This nondestructive technique allowed the measurements of Ca, P, O and C concentrations above the limit of 100 μg/g. (author)

Advanced characterization of materials using swift ion beams

Energy Technology Data Exchange (ETDEWEB)

Tabacniks, Manfredo H. [Universidade de Sao Paulo (USP), SP (Brazil)

2011-07-01

Swift ion beams are powerful non destructive tools for material analysis especially thin films. In spite of their high energy, usually several MeV/u, little energy is deposited by the ion on the sample. Energetic ions also use to stop far away (or outside) the inspected volume, hence producing negligible damage to the sample. Ion beam methods provide quantitative trace element analysis of any atomic element (and some isotopes) in a sample and are able to yield elemental depth profiles with spatial resolution of the order of 10mm. Relying on nuclear properties of the atoms, these methods are insensitive to the chemical environment of the element, consequently not limited by matrix effects. Ion beam methods are multielemental, can handle insulating materials, are quick (an analysis usually takes less than 15 minutes), and need little (if any) sample preparation. Ion beams are also sensitive to surface roughness and sample porosity and can be used to quickly inspect these properties in a sample. The Laboratory for Ion Beam Analysis of the University of Sao Paulo, LAMFI, is a multi-user facility dedicated to provide Ion Beam Methods like PIXE, RBS, FRS and NRA techniques for the analysis of materials and thin films. Operating since 1994, LAMFI is being used mostly by many researchers from within and outside USP, most of them non specialists in ion beam methods, but in need of ion beam analysis to carry out their research. At LAMFI, during the last 9 years, more than 50% of the accelerator time was dedicated to analysis, usually PIXE or RBS. 21% was down time and about 14% of the time was used for the development of ion beam methods which includes the use of RBS for roughness characterization exploring the shading of the beam by structures on the surface and by modeling the RBS spectrum as the product of a normalized RBS spectrum and a height density distribution function of the surface. Single element thick target PIXE analysis is being developed to obtain the thin

Advanced characterization of materials using swift ion beams

International Nuclear Information System (INIS)

Tabacniks, Manfredo H.

2011-01-01

Swift ion beams are powerful non destructive tools for material analysis especially thin films. In spite of their high energy, usually several MeV/u, little energy is deposited by the ion on the sample. Energetic ions also use to stop far away (or outside) the inspected volume, hence producing negligible damage to the sample. Ion beam methods provide quantitative trace element analysis of any atomic element (and some isotopes) in a sample and are able to yield elemental depth profiles with spatial resolution of the order of 10mm. Relying on nuclear properties of the atoms, these methods are insensitive to the chemical environment of the element, consequently not limited by matrix effects. Ion beam methods are multielemental, can handle insulating materials, are quick (an analysis usually takes less than 15 minutes), and need little (if any) sample preparation. Ion beams are also sensitive to surface roughness and sample porosity and can be used to quickly inspect these properties in a sample. The Laboratory for Ion Beam Analysis of the University of Sao Paulo, LAMFI, is a multi-user facility dedicated to provide Ion Beam Methods like PIXE, RBS, FRS and NRA techniques for the analysis of materials and thin films. Operating since 1994, LAMFI is being used mostly by many researchers from within and outside USP, most of them non specialists in ion beam methods, but in need of ion beam analysis to carry out their research. At LAMFI, during the last 9 years, more than 50% of the accelerator time was dedicated to analysis, usually PIXE or RBS. 21% was down time and about 14% of the time was used for the development of ion beam methods which includes the use of RBS for roughness characterization exploring the shading of the beam by structures on the surface and by modeling the RBS spectrum as the product of a normalized RBS spectrum and a height density distribution function of the surface. Single element thick target PIXE analysis is being developed to obtain the thin

Magnetoresistive nanojunctions fabricated via focused ion beam implantation

Energy Technology Data Exchange (ETDEWEB)

Stefanescu, E.; Hong, J.; Guduru, R. [Florida International University (United States); Lavrenov, A. [Hitachi Research (United States); Litvinov, D. [University of Houston, Center for Nanomagnetic Systems (United States); Khizroev, S., E-mail: khizroev@fiu.edu [Florida International University (United States)

2013-01-15

Focused ion beam (FIB) is used to implant Ga{sup +} ions into a 30-nm thick magnetoresistive element to effectively reduce the track width of the sensor from 1 Micro-Sign m to {approx}80 nm. Through magnetic recording industry-standard spinstand measurements, it is confirmed that a dose of {approx}10{sup 3} ions/cm{sup 2} at a 1-pA FIB current is sufficient to fully 'de-activate' magnetism in the exposed side regions. To record tracks required for spinstand tests, a FIB-trimmed ring type write head is used.

Development of the Holifield Radioactive Ion Beam Facility

International Nuclear Information System (INIS)

Tatum, B.A.

1997-01-01

The Holifield Radioactive Ion Beam Facility (HRIBF) construction project has been completed and the first radioactive ion beam has been successfully accelerated. The project, which began in 1992, has involved numerous facility modifications. The Oak Ridge Isochronous Cyclotron has been converted from an energy booster for heavy ion beams to a light ion accelerator with internal ion source. A target-ion source and mass analysis system have been commissioned as key components of the facility's radioactive ion beam injector to the 25MV tandem electrostatic accelerator. Beam transport lines have been completed, and new diagnostics for very low intensity beams have been developed. Work continues on a unified control system. Development of research quality radioactive beams for the nuclear structure and nuclear astrophysics communities continues. This paper details facility development to date

Ion Beam Propulsion Study

Science.gov (United States)

2008-01-01

The Ion Beam Propulsion Study was a joint high-level study between the Applied Physics Laboratory operated by NASA and ASRC Aerospace at Kennedy Space Center, Florida, and Berkeley Scientific, Berkeley, California. The results were promising and suggested that work should continue if future funding becomes available. The application of ion thrusters for spacecraft propulsion is limited to quite modest ion sources with similarly modest ion beam parameters because of the mass penalty associated with the ion source and its power supply system. Also, the ion source technology has not been able to provide very high-power ion beams. Small ion beam propulsion systems were used with considerable success. Ion propulsion systems brought into practice use an onboard ion source to form an energetic ion beam, typically Xe+ ions, as the propellant. Such systems were used for steering and correction of telecommunication satellites and as the main thruster for the Deep Space 1 demonstration mission. In recent years, "giant" ion sources were developed for the controlled-fusion research effort worldwide, with beam parameters many orders of magnitude greater than the tiny ones of conventional space thruster application. The advent of such huge ion beam sources and the need for advanced propulsion systems for exploration of the solar system suggest a fresh look at ion beam propulsion, now with the giant fusion sources in mind.

Development and Commissioning of an External Beam Facility in the Union College Ion Beam Analysis Laboratory

Science.gov (United States)

Yoskowitz, Joshua; Clark, Morgan; Labrake, Scott; Vineyard, Michael

2015-10-01

We have developed an external beam facility for the 1.1-MV tandem Pelletron accelerator in the Union College Ion Beam Analysis Laboratory. The beam is extracted from an aluminum pipe through a 1 / 4 ' ' diameter window with a 7.5- μm thick Kapton foil. This external beam facility allows us to perform ion beam analysis on samples that cannot be put under vacuum, including wet samples and samples too large to fit into the scattering chamber. We have commissioned the new facility by performing proton induced X-ray emission (PIXE) analysis of several samples of environmental interest. These include samples of artificial turf, running tracks, and a human tooth with an amalgam filling. A 1.7-MeV external proton beam was incident on the samples positioned 2 cm from the window. The resulting X-rays were measured using a silicon drift detector and were analyzed using GUPIX software to determine the concentrations of elements in the samples. The results on the human tooth indicate that while significant concentrations of Hg, Ag, and Sn are present in the amalgam filling, only trace amounts of Hg appear to have leached into the tooth. The artificial turf and running tracks show rather large concentrations of a broad range of elements and trace amounts of Pb in the turf infill.

Analysis of art objects by means of ion beam induced luminescence

International Nuclear Information System (INIS)

Quaranta, A; Dran, J C; Salomon, J; Pivin, J C; Vomiero, A; Tonezzer, M; Maggioni, G; Carturan, S; Mea, G Della

2006-01-01

The impact of energetic ions on solid samples gives rise to the emission of visible light owing to the electronic excitation of intrinsic defects or extrinsic impurities. The intensity and position of the emission features provide information on the nature of the luminescence centers and on their chemical environments. This makes ion beam induced luminescence (IBIL) a useful complement to other ion beam analyses, like PIXE, in the cultural heritage field in characterizing the composition and the provenience of art objects. In the present paper, IBIL measurements have been performed on inorganic pigments for underlying the complementary role played by IBIL in the analysis of artistic works. Some blue and red pigment has been presented as case study

Ga+ implantation in a PZT film during focused ion beam micro-machining

International Nuclear Information System (INIS)

Wollschlaeger, Nicole; Oesterle, Werner; Haeusler, Ines; Stewart, Mark

2015-01-01

The objective of the present work was to study the impact of Focused Ion Beam (FIB) machining parameters on the thickness of the damaged layer within a thin film PZT. Therefore, different Ga + - ion doses and ion energies were applied to a standard PZT film (80/20 lead zirconium titanate) under two beam incidence angles (90 and 1 ). The thicknesses of the corresponding Ga + -implanted layers were then determined by cross-sectional TEM in combination with energy dispersive spectroscopic (EDS) line-scans and correlated with polarisation hysteresis loops. The results show a decrease of Ga + -implanted layer thickness with decreasing inclination angle, whereas ion energy and ion dose could be correlated with gallium concentration in the implanted layers. Under the most unfavorable conditions the depth of the affected zone was 26 nm, it was only 2 nm for the most favorable conditions. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Atmosphere influence on in situ ion beam analysis of thin film growth

International Nuclear Information System (INIS)

Lin, Yuping; Krauss, A.R.; Gruen, D.M.; Chang, R.P.H.; Auciello, O.H.; Schultz, J.A.

1994-01-01

In situ, nondestructive surface characterization of thin-film growth processes in an environment of chemically active gas at pressures of several mTorr is required both for the understanding of growth processes in multicomponent films and layered heterostructures and for the improvement of process reproducibility and device reliability. The authors have developed a differentially pumped pulsed ion beam surface analysis system that includes ion scattering spectroscopy (ISS) and direct recoil spectroscopy (DRS), coupled to an automated ion beam sputter-deposition system (IBSD), to study film growth processes in an environment of chemically active gas, such as required for the growth of oxide, nitride, or diamond thin films. The influence of gas-phase scattering and gas-surface interactions on the ISS and DRS signal intensity and peak shape have been studied. From the intensity variation as a function of ambient gas pressure, the authors have calculated the mean free path and the scattering cross-section for a given combination of primary ion species and ambient gas. Depending on the system geometry and the combination of primary beam and background, it is shown that surface-specific data can be obtained during thin-film growth at pressures ranging from a few mtorr to approximately 1 Torr. Detailed information such as surface composition, structure, and film growth mechanism may be obtained in real-time, making ion beam analysis an ideal nondestructive, in situ probe of thin-film growth processes

Ion beam analysis and modern materials science

International Nuclear Information System (INIS)

Feldman, Leonard C.

2012-01-01

Full text: Modern research has provided the means of creating materials structures controlled at the atomic scale. Familiar examples include the formation of hetero-structures grown with atomic precision, nanostructures with designed electronic properties and new organic structures employing the richness of organic chemistry. The current forefront of such materials research includes the creation of new materials for energy and electronics applications. The electron transport properties of these diverse materials, and hence their performance, is invariably linked by the basic interactions at the interface. Interfaces are the critical component, and least understood aspect, of almost all such materials-based structures. Ion beam analysis, and its role in interfacial definition, will be described in the context of a number of such forefront projects underway at the Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN). These include: 1) quantitative analysis of self-assembled monolayers on organic single crystals resulting in enhanced surface mobility and more effective organic field effect transistors, 2) monolayer scale interfacial analysis of complex oxide hetero-structures to elucidate the properties of the enhanced two-dimensional electron mobility and 3) characterization of the semiconductor- dielectric interface in the SiC/SiO2 system, with application for energy efficient power transmission. Despite extraordinary advances in synthesis, interface properties continue as an uncontrolled region of hetero-materials formation. Their understanding requires the detailed analysis of a complement of tools including ion beam analysis. Fellow Researchers: R. A. Bartynski, L.C.Feldman, E. Garfunkel, T. Gustafsson, H.D. Lee, D. Mastrogiovanni, V. Podzorov, L. S. Wielunski, J. R. Williams(Auburn), G. Liu, J. Williams, S. Dhar. (author)

Alignment of dipole magnet in micro-beam line of HIRFL

International Nuclear Information System (INIS)

Wang Shaoming; Chen Wenjun; Yang Shengli; Cai Guozhu; Guo Yizhen; Zhou Guangming; Man Kaidi; Song Mingtao

2010-01-01

Microbeam irradiation facility is an experiment platform, which can reduce the beam-spot on the irradiated sample to micrometer level, and can accurately locate and count the radioactive particles. It is a powerful research tool for the irradiation material science, irradiation biology, irradiation biomedicine and micro mechanical machining. The microbeam irradiation facility requires the precise work for installation and alignment. These conditions make magnet's change for directions and positions because the location space of dipole magnets in micro-beam line of HIRFL (Heavy Ion Research Facility in Lanzhou) is very small. It is a challenge for the installation and alignment work of magnets. It was solved by transforming coordinates of benchmarks of magnets, which controlled the error of magnet setup within error tolerance range. (authors)

Localized subsurface modification of materials using micro-low-energy multiple ion beamlets

Directory of Open Access Journals (Sweden)

Abhishek Chowdhury

2011-12-01

Full Text Available Generation of focused multiple ion beamlets from an intense microwave plasma source is investigated for the creation of localized subsurface modification of materials. Unlike conventional single element focused ion beam (FIB systems, the plasma source is capable of providing ion beams of multiple elements. Two types of plasma electrodes (PE are employed, one with a honeycomb structure with notched apertures and another with a 5×5 array of through apertures, both attached to the plasma source and are capable of generating focused ion beamlets (50 - 100 μm diameter in a patterned manner. Measurements of ion saturation current near the PE indicate that the plasma is uniform over an area of ∼ 7 cm2, which is further confirmed by uniformity in extracted beam current through the apertures. The ion beams are applied to investigate change in electrical sheet resistance Rs of metallic thin films in a controlled manner by varying the ionic species and beam energy. Results indicate a remarkable increase in Rs with beam energy (∼ 50 % at 1 keV for Ar ions, and with ionic species (∼ 90% for Krypton ions at 0.6 keV, when 80 nm thick copper films are irradiated by ∼2 cm diameter ion beams. Ion induced surface roughness is considered as the main mechanism for this change as confirmed by atomic force microscopy (AFM measurements. Predictions for micro-beamlet induced change in Rs are discussed. The experimental results are verified using TRIM and AXCEL-INP simulations.

IMAP: A complete Ion Micro-Analysis Package for the nuclear microprobe

International Nuclear Information System (INIS)

Antolak, A.J.; Hildner, M.L.; Morse, D.H.; Bench, G.S.

1993-01-01

Microprobe techniques using scanned, focused MeV ions are routinely used in Livermore for materials characterization. Comprehensive data analysis with these techniques is accomplished with the computer software package IMAP, for Ion Micro-Analysis Package. IMAP consists of a set of command language procedures for data processing and quantitative spectral analysis. Deconvolution of the data is achieved by spawning sub-processes within IMAP which execute analysis codes for each specific microprobe technique. IMAP is structured to rapidly analyze individual spectra or multi-dimensional data blocks which classify individual events by the two scanning dimensions, the energy of the detected radiation and, when necessary, one sample rotation dimension. Several examples are presented to demonstrate the utility of the package

Studies for the development of a micro-focus monochromatic x-ray source with making use of a highly charged heavy ion beam

International Nuclear Information System (INIS)

Nakamura, Nobuyuki; Yoshiyasu, Nobuo; Nakayama, Ryo; Watanabe, Hirofumi

2008-01-01

We propose a new scheme for a micro-focus monochromatic X-ray source using a focused highly charged ion beam colliding with a solid surface. When highly charged ion approaches a surface, many electrons are captured into the ion and the so-called hollow atom is produced. The hollow atom will decay by emitting X-rays before and after hitting the surface. Such X-rays do not contain any contribution from bremsstrahlung, so that monochromatic X-rays can be obtained by using proper filters. For the first step of realizing the proposed scheme, an ion focusing system with a glass capillary has been developed. In order to study the monochromaticity of the emission, X-ray spectra from hollow atoms produced in the collisions between highly charged heavy ions and several surfaces have been observed. (author)

Hydrogen microscopy and analysis of DNA repair using focused high energy ion beams

Energy Technology Data Exchange (ETDEWEB)

Dollinger, G. [Universitaet der Bundeswehr Muenchen, LRT 2, Werner Heisenberg Weg 39, D-85579 Neubiberg (Germany)]. E-mail: guenther.dollinger@unibw.de; Bergmaier, A. [Universitaet der Bundeswehr Muenchen, LRT 2, Werner Heisenberg Weg 39, D-85579 Neubiberg (Germany); Hauptner, A. [Physik Department E 12, Technische Universitaet Muenchen, D-85748 Garching (Germany); Dietzel, S. [Department Biologie II, Ludwigs-Maximilians-Universitaet Muenchen, Grosshaderner Str. 2, 82152 Planegg-Martinsried (Germany); Drexler, G.A. [Strahlenbiologisches Institut, LMU Muenchen, Schillerstr. 42, D-80336 Muenchen und Institut fuer Strahlenbiologie, GSF-Forschungszentrum, D-85764 Neuherberg (Germany); Greubel, C. [Physik Department E 12, Technische Universitaet Muenchen, D-85748 Garching (Germany); Hable, V. [Universitaet der Bundeswehr Muenchen, LRT 2, Werner Heisenberg Weg 39, D-85579 Neubiberg (Germany); Reichart, P. [School of Physics, University of Melbourne, Victoria 3010 (Australia); Kruecken, R. [Physik Department E 12, Technische Universitaet Muenchen, D-85748 Garching (Germany); Cremer, T. [Department Biologie II, Ludwigs-Maximilians-Universitaet Muenchen, Grosshaderner Str. 2, 82152 Planegg-Martinsried (Germany); Friedl, A.A. [Strahlenbiologisches Institut, LMU Muenchen, Schillerstr. 42, D-80336 Muenchen und Institut fuer Strahlenbiologie, GSF-Forschungszentrum, D-85764 Neuherberg (Germany)

2006-08-15

The ion microprobe SNAKE (Supraleitendes Nanoskop fuer Angewandte Kernphysikalische Experimente) at the Munich 14 MV tandem accelerator achieves beam focussing by a superconducting quadrupole doublet and can make use of a broad range of ions and ion energies, i.e. 4-28 MeV protons or up to 250 MeV gold ions. Due to these ion beams, SNAKE is particularly attractive for ion beam analyses in various fields. Here we describe two main applications of SNAKE. One is the unique possibility to perform three-dimensional hydrogen microscopy by elastic proton-proton scattering utilizing high energy proton beams. The high proton energies allow the analysis of samples with a thickness in the 100 {mu}m range with micrometer resolution and a sensitivity better than 1 ppm. In a second application, SNAKE is used to analyse protein dynamics in cells by irradiating live cells with single focussed ions. Fluorescence from immunostained protein 53BP1 is used as biological track detector after irradiation of HeLa cells. It is used to examine the irradiated region in comparison with the targeted region. Observed patterns of fluorescence foci agree reasonably well with irradiation patterns, indicating an overall targeting accuracy of about 2 {mu}m while the beam spot size is less than 0.5 {mu}m in diameter. This performance shows successful adaptation of SNAKE for biological experiments where cells are targeted on a sub-cellular level by energetic ions.

Ion beam neutralization with ferroelectrically generated electron beams

Energy Technology Data Exchange (ETDEWEB)

Herleb, U; Riege, H [European Organization for Nuclear Research, Geneva (Switzerland). LHC Division

1997-12-31

A technique for ion beam space-charge neutralization with pulsed electron beams is described. The intensity of multiply-charged ions produced with a laser ion source can be enhanced or decreased separately with electron beam trains of MHz repetition rate. These are generated with ferroelectric cathodes, which are pulsed in synchronization with the laser ion source. The pulsed electron beams guide the ion beam in a similar way to the alternating gradient focusing of charged particle beams in circular accelerators such as synchrotrons. This new neutralization technology overcomes the Langmuir-Child space-charge limit and may in future allow ion beam currents to be transported with intensities by orders of magnitude higher than those which can be accelerated today in a single vacuum tube. (author). 6 figs., 10 refs.

In vitro and in vivo ion beam targeted micro-irradiation for radiobiology

International Nuclear Information System (INIS)

Vianna, Francois

2014-01-01

The main goal of radiobiology is to understand the effects of ionizing radiations on the living. These past decades, ion microbeams have shown to be important tools to study for example the effects of low dose exposure, or the bystander effect. Since 2003, the CENBG has been equipped with a system to perform targeted micro-irradiation of living samples. Recently, microbeams applications on this subject have diversified and the study of DNA repair mechanisms at the cellular and multicellular scales, in vitro and in vivo, has become possible thanks to important evolutions of fluorescence imaging techniques and cellular biology. To take into account these new approaches, the CENBG micro-irradiation beamline has been entirely redesigned and rebuilt to implement new features and to improve the existing ones. My PhD objectives were i) commissioning the facility, ii) characterizing the system on track etch detectors, and on living samples, iii) implementing protocols to perform targeted irradiations of living samples with a con-trolled delivered dose, at the cellular and multicellular scales, and to visualize the early consequences online, iv) modelling these irradiations to explain the biological results using the calculated physical data. The work of these past years has allowed us i) to measure the performances of our system: a beam spot size of about 2 μm and a targeting accuracy of ± 2 μm, and to develop ion detection systems for an absolute delivered dose control, ii) to create highly localized radiation-induced DNA damages and to see online the recruitment of DNA repair proteins, iii) to apply these protocols to generate radiation-induced DNA damages in vivo inside a multicellular organism at the embryonic stage: Caenorhabditis elegans. These results have opened up many perspectives on the study of the interaction between ionizing radiations and the living, at the cellular and multicellular scales, in vitro and in vivo. (author) [fr

Statistically sound evaluation of trace element depth profiles by ion beam analysis

International Nuclear Information System (INIS)

Schmid, K.; Toussaint, U. von

2012-01-01

This paper presents the underlying physics and statistical models that are used in the newly developed program NRADC for fully automated deconvolution of trace level impurity depth profiles from ion beam data. The program applies Bayesian statistics to find the most probable depth profile given ion beam data measured at different energies and angles for a single sample. Limiting the analysis to % level amounts of material allows one to linearize the forward calculation of ion beam data which greatly improves the computation speed. This allows for the first time to apply the maximum likelihood approach to both the fitting of the experimental data and the determination of confidence intervals of the depth profiles for real world applications. The different steps during the automated deconvolution will be exemplified by applying the program to artificial and real experimental data.

Electron Beam Ion Sources

CERN Document Server

Zschornacka, G.; Thorn, A.

2013-12-16

Electron beam ion sources (EBISs) are ion sources that work based on the principle of electron impact ionization, allowing the production of very highly charged ions. The ions produced can be extracted as a DC ion beam as well as ion pulses of different time structures. In comparison to most of the other known ion sources, EBISs feature ion beams with very good beam emittances and a low energy spread. Furthermore, EBISs are excellent sources of photons (X-rays, ultraviolet, extreme ultraviolet, visible light) from highly charged ions. This chapter gives an overview of EBIS physics, the principle of operation, and the known technical solutions. Using examples, the performance of EBISs as well as their applications in various fields of basic research, technology and medicine are discussed.

Ion beam diagnosis

International Nuclear Information System (INIS)

Strehl, P.

1994-04-01

This report is an introduction to ion beam diagnosis. After a short description of the most important ion beam parameters measurements of the beam current by means of Faraday cups, calorimetry, and beam current transformers and measurements of the beam profile by means of viewing screens, profile grids and scanning devices, and residual gas ionization monitors are described. Finally measurements in the transverse and longitudinal phase space are considered. (HSI)

Applications of factor analysis to electron and ion beam surface techniques

International Nuclear Information System (INIS)

Solomon, J.S.

1987-01-01

Factor analysis, a mathematical technique for extracting chemical information from matrices of data, is used to enhance Auger electron spectroscopy (AES), core level electron energy loss spectroscopy (EELS), ion scattering spectroscopy (ISS), and secondary ion mass spectroscopy (SIMS) in studies of interfaces, thin films, and surfaces. Several examples of factor analysis enhancement of chemical bonding variations in thin films and at interfaces studied with AES and SIMS are presented. Factor analysis is also shown to be of great benefit in quantifying electron and ion beam doses required to induce surface damage. Finally, examples are presented of the use of factor analysis to reconstruct elemental profiles when peaks of interest overlap each other during the course of depth profile analysis. (author)

Ion beam induced luminescence from diamond using an MeV ion microprobe

Energy Technology Data Exchange (ETDEWEB)

Bettiol, A.A.; Jamieson, D. N.; Prawer, S.; Allen, M.G. [Melbourne Univ., Parkville, VIC (Australia). School of Physics

1993-12-31

Analysis of the luminescence induced by a MeV ion beam offers the potential to provide useful information about the chemical properties of atoms in crystals to complement the information provided by more traditional Ion Beam Analysis (IBA) such as Rutherford Backscattering Spectrometry (RBS), ion channeling and Particle Induced X-ray Emission (PIXE). Furthermore, the large penetration depth of the MeV ion beam offers several advantages over the relatively shallow penetration of keV electrons typically employed in cathodoluminescence. An Ion Beam Induced Luminescence (IBIL) detection system was developed for the Melbourne microprobe that allows the spatial mapping of the luminescence signal along with the signals from RBS and PIXE. Homoepitaxial diamond growth has been studied and remarkable shifts in the characteristic blue luminescence of diamond towards the green were observed in the overgrowth. This has been tentatively identified as being due to transition metal inclusions in the epitaxial layers. 8 refs., 2 refs.

Ion beam induced luminescence from diamond using an MeV ion microprobe

Energy Technology Data Exchange (ETDEWEB)

Bettiol, A A; Jamieson, D N; Prawer, S; Allen, M G [Melbourne Univ., Parkville, VIC (Australia). School of Physics

1994-12-31

Analysis of the luminescence induced by a MeV ion beam offers the potential to provide useful information about the chemical properties of atoms in crystals to complement the information provided by more traditional Ion Beam Analysis (IBA) such as Rutherford Backscattering Spectrometry (RBS), ion channeling and Particle Induced X-ray Emission (PIXE). Furthermore, the large penetration depth of the MeV ion beam offers several advantages over the relatively shallow penetration of keV electrons typically employed in cathodoluminescence. An Ion Beam Induced Luminescence (IBIL) detection system was developed for the Melbourne microprobe that allows the spatial mapping of the luminescence signal along with the signals from RBS and PIXE. Homoepitaxial diamond growth has been studied and remarkable shifts in the characteristic blue luminescence of diamond towards the green were observed in the overgrowth. This has been tentatively identified as being due to transition metal inclusions in the epitaxial layers. 8 refs., 2 refs.

Morphological change of self-organized protrusions of fluoropolymer surface by ion beam irradiation

International Nuclear Information System (INIS)

Kitamura, Akane; Kobayashi, Tomohiro; Satoh, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Suzuki, Akihiro; Terai, Takayuki

2013-01-01

Polytetrafluoroethylene (PTFE) and fluorinated ethylene propylene (FEP) are typical fluoropolymers displaying several desirable technological properties such as electrical insulation and high chemical resistance. When their surfaces are irradiated with ion beams, dense micro-protrusions formed after the emergence and spread of micropores across the entire irradiated area, allowing culture cells to spread on the top of the protrusions. In this study, we investigate the morphological changes introduced in the fluoropolymer surfaces by ion beams as the energy of the beams is increased. When an FEP sample was irradiated with a nitrogen ion beam with an energy of less than 350 keV at 1.0 μA/cm 2 , protrusions were formed with a density between 2 × 10 7 /cm 2 and 2 × 10 8 /cm 2 . However, at energies higher than 350 keV, the protrusions became sparse, and the density dropped to 5 × 10 2 /cm 2 . Protrusions appeared sporadically during irradiation at high energies, and the top of the protrusions appeared as spots inside the sample, which were difficult to etch and became elongated as the erosion of the surface progressed. Erosion was caused by sputtering of FEP molecules and evaporation at notably elevated temperatures on the surface. Analysis based on attenuated total reflectance/Fourier transform infrared spectroscopy showed the presence of C=C bonds as well as –COOH, –C=O, and –OH bonds on all irradiated samples. Their concentration on the surface densely covered with micro-protrusions was higher than that on the surface with sparse protrusions after irradiation at energies exceeding 350 keV. Thus, we determined a suitable range for the ion energy for creating FEP surfaces densely covered with protrusions

A Study on the Ion Beam Extraction using Duo-PiGatron Ion source for Vertical Type Ion Beam Facility

Energy Technology Data Exchange (ETDEWEB)

Kim, Bom Sok; Lee, Chan young; Lee, Jae Sang [KAERI, Daejeon (Korea, Republic of)

2015-05-15

In Korea Multipurpose Accelerator Complex (KOMAC), we have started ion beam service in the new beam utilization building since March this year. For various ion beam irradiation services, we are developed implanters such as metal (150keV/1mA), gaseous (200keV/5mA) and high current ion beam facility (20keV/150mA). One of the new one is a vertical type ion beam facility without acceleration tube (60keV/20mA) which is easy to install the sample. After the installation is complete, it is where you are studying the optimal ion beam extraction process. Detailed experimental results will be presented. Vertical Type Ion Beam Facility without acceleration tube of 60keV 20mA class was installed. We successfully extracted 60keV 20mA using Duo- PiGatron Ion source for Vertical Type Ion Beam Facility. Use the BPM and Faraday-cup, is being studied the optimum conditions of ion beam extraction.

Ion beams in silicon processing and characterization

International Nuclear Information System (INIS)

Chason, E.; Picraux, S.T.; Poate, J.M.; Borland, J.O.; Current, M.I.; Diaz de la Rubia, T.; Eaglesham, D.J.; Holland, O.W.; Law, M.E.; Magee, C.W.; Mayer, J.W.; Melngailis, J.; Tasch, A.F.

1997-01-01

General trends in integrated circuit technology toward smaller device dimensions, lower thermal budgets, and simplified processing steps present severe physical and engineering challenges to ion implantation. These challenges, together with the need for physically based models at exceedingly small dimensions, are leading to a new level of understanding of fundamental defect science in Si. In this article, we review the current status and future trends in ion implantation of Si at low and high energies with particular emphasis on areas where recent advances have been made and where further understanding is needed. Particularly interesting are the emerging approaches to defect and dopant distribution modeling, transient enhanced diffusion, high energy implantation and defect accumulation, and metal impurity gettering. Developments in the use of ion beams for analysis indicate much progress has been made in one-dimensional analysis, but that severe challenges for two-dimensional characterization remain. The breadth of ion beams in the semiconductor industry is illustrated by the successful use of focused beams for machining and repair, and the development of ion-based lithographic systems. This suite of ion beam processing, modeling, and analysis techniques will be explored both from the perspective of the emerging science issues and from the technological challenges. copyright 1997 American Institute of Physics

Hydrogen ion species analysis and related neutral beam injection power assessment in the Heliotron E neutral beam injection system

International Nuclear Information System (INIS)

Sano, Fumimichi; Obiki, Tokuhiro; Sasaki, Akihiko; Iiyoshi, Atsuo; Uo, Koji

1982-01-01

The hydrogen ion species in a Heliotron E neutral beam injection system of maximum electric power 6.3 MW were analyzed in order to assess the neutral beam power injected into the torus. The masimum p roton ratio of the cylindrical bucket type ion source used was observed to be more than 90 percent assuming that the angular divergences for the respective species in the beam are the same. The experimental data are compared with calculations using a particle balance model. The analysis indicates that the net injection power reaches nearly 2.7 MW at the optimal conditions of the system considering the geometrical limitation of the neutral beam path. (author)

Mutation induction by ion beams in plants

International Nuclear Information System (INIS)

Tanaka, Atsushi

2001-01-01

The effect of ion beams such as C, He, and Ne ions was investigated on the mutation induction in plants with the expectation that ion beams of high linear energy transfer (LET) can frequently produce large DNA alternation such as inversion, translocation and large deletion rather than point mutation. Mutation frequency was investigated using Arabidopsis visible phenotype loci and was 8 to 33 fold higher for 220 MeV carbon ions than for electrons. Mutation spectrum was investigated on the flower color of chrysanthemum cv to find that flower mutants induced by ion beams show complex and stripe types rather than single color. Polymerase chain reaction analysis was performed to investigate DNA alteration of mutations. In conclusion, the characteristics of ion beams for the mutation induction are 1) high frequency, 2) broad mutation spectrum, and 3) novel mutants. (S. Ohno)

Mutation induction by ion beams in plants

Energy Technology Data Exchange (ETDEWEB)

Tanaka, Atsushi [Japan Atomic Energy Research Inst., Takasaki, Gunma (Japan). Takasaki Radiation Chemistry Research Establishment

2001-03-01

The effect of ion beams such as C, He, and Ne ions was investigated on the mutation induction in plants with the expectation that ion beams of high linear energy transfer (LET) can frequently produce large DNA alternation such as inversion, translocation and large deletion rather than point mutation. Mutation frequency was investigated using Arabidopsis visible phenotype loci and was 8 to 33 fold higher for 220 MeV carbon ions than for electrons. Mutation spectrum was investigated on the flower color of chrysanthemum cv to find that flower mutants induced by ion beams show complex and stripe types rather than single color. Polymerase chain reaction analysis was performed to investigate DNA alteration of mutations. In conclusion, the characteristics of ion beams for the mutation induction are 1) high frequency, 2) broad mutation spectrum, and 3) novel mutants. (S. Ohno)

Assessment for ion beam analysis methods about hydrogen isotope in hydrogen storaged metal

International Nuclear Information System (INIS)

Ding Wei; Long Xinggui; Shi Liqun

2006-01-01

In this paper, experimental arrangements of measuring hydrogen isotope concentration and distribution in metal hydride with ion beam analysis methods were reported, and the advantage and disadvantage of different methods were analyzed too. Experiment results show that it can get abundant information and accurate value by these ways. It can get an accurate value since it's the Rutherford cross-section, and the Mylar film used in the experiment is thin enough for H, D and T distinguishing each other while using ERD analysis method with 6.0 MeV O ion beam to proceed this work, but the disadvantage of this method is that the sample preparing is more difficult, and the analysis depth is lower. It could get the distribution information of H, D and T and the analysis depth is about 3.0 μm while using ERD analysis method with 7.4 MeV 4 He ion beam, but the disadvantage is that the spectra of H, D and T overlap each other, which makes a big error in simulated calculation. If using PBS method with 3.0 MeV proton, the analysis depth is deeper, but it couldn't get the H distribution information. (authors)

Electron and ion beam degradation effects in AES analysis of silicon nitride thin films

International Nuclear Information System (INIS)

Fransen, F.; Vanden Berghe, R.; Vlaeminck, R.; Hinoul, M.; Remmerie, J.; Maes, H.E.

1985-01-01

Silicon nitride films are currently investigated by AES combined with ion profiling techniques for their stoichiometry and oxygen content. During this analysis, ion beam and primary electron effects were observed. The effect of argon ion bombardment is the preferential sputtering of nitrogen, forming 'covalent' silicon at the surface layer (AES peak at 91 eV). The electron beam irradiation results in a decrease of the covalent silicon peak, either by an electron beam annealing effect in the bulk of the silicon nitride film, or by an ionization enhanced surface diffusion process of the silicon (electromigration). By the electron beam annealing, nitrogen species are liberated in the bulk of the silicon nitride film and migrate towards the surface where they react with the covalent silicon. The ionization enhanced diffusion originates from local charging of the surface, induced by the electron beam. (author)

Beam-plasma instability in ion beam systems used in neutral beam generation

International Nuclear Information System (INIS)

Hooper, E.B. Jr.

1977-02-01

The beam-plasma instability is analyzed for the ion beams used for neutral beam generation. Both positive and negative ion beams are considered. Stability is predicted when the beam velocity is less than the electron thermal velocity; the only exception occurs when the electron density accompanying a negative ion beam is less than the ion density by nearly the ratio of electron to ion masses. For cases in which the beam velocity is greater than the electron thermal velocity, instability is predicted near the electron plasma frequency

Ion-beam apparatus and method for analyzing and controlling integrated circuits

Science.gov (United States)

Campbell, Ann N.; Soden, Jerry M.

1998-01-01

An ion-beam apparatus and method for analyzing and controlling integrated circuits. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal.

Development of a single ion micro-irradiation facility for experimental radiobiology at cell level

International Nuclear Information System (INIS)

Barberet, Ph.

2003-10-01

A micro-irradiation device has been developed for radiobiology applications at the scale of the cell. This device is based on an upgrade of an existing micro-beam line that was already able to deliver a 1 to 3 MeV proton or alpha beam of low intensity and whose space resolution is lower than 1 micrometer in vacuum. The important part of this work has been the development of an irradiation stage designed to fit on the micro-probe and able to deliver ions in the air with an absolute accuracy of a few micrometers. A program has been set up to monitor the complete irradiation line in testing and in automatic irradiation operating phases. Simulation tools based on Monte-Carlo calculations have been validated through comparisons with experimental data particularly in the field of spatial resolution and of the number of ions delivered. The promising results show the possibility in a near future to use this tool to study the response of cells to very low irradiation doses down to the extreme limit of one ion per cell

Individual analysis of nonmetallic Inclusions in Steel by using the gallium focused ion beam secondary ion mass spectrometry

International Nuclear Information System (INIS)

Tomiyasu, Bunbunoshin; Inami, Akihiro; Abe, Masakazu; Nihei, Yoshimasa.

1995-01-01

Nonmetallic inclusions frequently exert a lot of unfavorable influences on the quality of steel. The size of nonmetallic inclusions in current steel products is less than a few μm in diameter. It is desirable to make clear the origin and generation process of such small particles of nonmetallic inclusion. In order to measure the shape, size, composition and inner elemental distribution, development of characterization methods for each inclusion particle is required. By employing a gallium focused ion beam (FIB) as a primary ion beam of secondary ion mass spectrometry (SIMS), the particle analysis with high spatial resolution is easily achieved. In this paper, we present the novel individual analysis of nonmetallic inclusions in steel by gallium FIB SIMS. We analyzed in two ways the nonmetallic inclusion particles segregated by electron beam melting. (1) By cross-sectioning of the particle using a gallium FIB, elemental maps of cross-section were obtained. The elements were distributed inhomogeneously on the cross-section. (2) We carried out the compositional analysis for several particles individually. Ten particles were analyzed by the shave-off analysis and the multivariate cluster analysis. Based on the composition of each particle, the inclusions were classified into six types. (author)

Polarization Studies in Fast-Ion Beam Spectroscopy

International Nuclear Information System (INIS)

Trabert, E

2001-01-01

In a historical review, the observations and the insight gained from polarization studies of fast ions interacting with solid targets are presented. These began with J. Macek's recognition of zero-field quantum beats in beam-foil spectroscopy as indicating alignment, and D.G. Ellis' density operator analysis that suggested the observability of orientation when using tilted foils. Lastly H. Winter's studies of the ion-beam surface interaction at grazing incidence yielded the means to produce a high degree of nuclear orientation in ion beams

Biomaterials modification by ion beam

International Nuclear Information System (INIS)

Zhang Tonghe; Yi Zhongzhen; Zhang Xu; Wu Yuguang

2001-01-01

Ion beam technology is one of best ways for the modification of biomaterials. The results of ion beam modification of biomaterials are given. The method and results of improved biocompatibility are indicated by ion beam technology. The future development of ion beam modification of biomaterials is discussed

A new ion beam facility based on a 3 MV Tandetron™ at IFIN-HH, Romania

Science.gov (United States)

Burducea, I.; Straticiuc, M.; Ghiță, D. G.; Moșu, D. V.; Călinescu, C. I.; Podaru, N. C.; Mous, D. J. W.; Ursu, I.; Zamfir, N. V.

2015-09-01

A 3 MV Tandetron™ accelerator system has been installed and commissioned at the "Horia Hulubei" National Institute for Physics and Nuclear Engineering - IFIN-HH, Măgurele, Romania. The main purpose of this machine is to strengthen applied nuclear physics research ongoing in our institute for more than four decades. The accelerator system was developed by High Voltage Engineering Europa B.V. (HVE) and comprises three high energy beam lines. The first beam line is dedicated to ion beam analysis (IBA) techniques: Rutherford Backscattering Spectrometry - RBS, Nuclear Reaction Analysis - NRA, Particle Induced X-ray and γ-ray Emission - PIXE and PIGE and micro-beam experiments - μ-PIXE. The second beam line is dedicated to high energy ion implantation experiments and the third beam line was designed mainly for nuclear cross-sections measurements used in nuclear astrophysics. A unique feature, the first time in operation at an accelerator facility is the Na charge exchange canal (CEC), which is used to obtain high intensity beams of He- of at least 3 μA. The results of the acceptance tests demonstrate the huge potential of this new facility in various fields, from IBA to radiation hardness studies and from medical or environmental applications to astrophysics. The main features of the accelerator are presented in this paper.

Ga{sup +} implantation in a PZT film during focused ion beam micro-machining

Energy Technology Data Exchange (ETDEWEB)

Wollschlaeger, Nicole; Oesterle, Werner; Haeusler, Ines [Federal Institute for Materials Research and Testing, Unter den Eichen 87, 12205 Berlin (Germany); Stewart, Mark [National Physical Laboratory, Hampton Road, Teddington Middlesex TW 11 0LW (United Kingdom)

2015-03-01

The objective of the present work was to study the impact of Focused Ion Beam (FIB) machining parameters on the thickness of the damaged layer within a thin film PZT. Therefore, different Ga{sup +}- ion doses and ion energies were applied to a standard PZT film (80/20 lead zirconium titanate) under two beam incidence angles (90 and 1 ). The thicknesses of the corresponding Ga{sup +}-implanted layers were then determined by cross-sectional TEM in combination with energy dispersive spectroscopic (EDS) line-scans and correlated with polarisation hysteresis loops. The results show a decrease of Ga{sup +}-implanted layer thickness with decreasing inclination angle, whereas ion energy and ion dose could be correlated with gallium concentration in the implanted layers. Under the most unfavorable conditions the depth of the affected zone was 26 nm, it was only 2 nm for the most favorable conditions. (copyright 2015 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

Laser beam micro-milling of micro-channels in aerospace alloys

CERN Document Server

Ahmed, Naveed; Al-Ahmari, Abdulrahman

2017-01-01

This volume is greatly helpful to micro-machining and laser engineers as it offers obliging guidelines about the micro-channel fabrications through Nd:YAG laser beam micro-milling. The book also demonstrates how the laser beam micro-milling behaves when operating under wet conditions (under water), and explores what are the pros and cons of this hybrid technique. From the predictive mathematical models, the readers can easily estimate the resulting micro-channel size against the desired laser parametric combinations. The book considers micro-channels in three highly important research materials commonly used in aerospace industry: titanium alloy Ti-6Al-4V, nickel alloy Inconel 718 and aluminum alloy AA 2024. Therefore, the book is highly practicable in the fields of micro-channel heat exchangers, micro-channel aerospace turbine blades, micro-channel heat pipes, micro-coolers and micro-channel pulsating heat plates. These are frequently used in various industries such as aerospace, automotive, biomedical and m...

Effects of focused ion beam milling on the compressive behavior of directionally solidified micro-pillars and the nanoindentation response of an electro-polished surface

International Nuclear Information System (INIS)

Shim, Sang Hoon; Bei, Hongbin; Miller, Michael K; Pharr, George Mathews; George, Easo P

2009-01-01

Focused ion beam (FIB) milling is the typical way in which micro-pillars are fabricated to study small-scale plasticity and size effects in uniaxial compression. However, FIB milling can introduce defects into the milled pillars. To investigate the effects of FIB damage on mechanical behavior, we tested Mo-alloy micro-pillars that were FIB milled following directional solidification, and compared their compressive response to pillars that were not FIB milled. We also FIB milled at glancing incidence a Mo-alloy single-crystal surface, and compared its nanoindentation response to an electro-polished surface of the same crystal. Consequences for the interpretation of data obtained from FIB milled micro-pillars are discussed

Energy spread in ion beam analysis

International Nuclear Information System (INIS)

Szilagyi, E.

2000-01-01

In ion beam analysis (IBA) the depth profiles are extracted from the experimentally determined energy profiles. The spectra, however, are subject to finite energy resolution of both extrinsic and intrinsic origin. Calculation of those effects such as instrumental beam, geometry and detection-related energy and angular spreads as well as energy straggling, multiple scattering and Doppler effects in the sample itself is not trivial, especially since it involves treatment of non-independent random processes. A proper account for energy spread is vital in IBA not only for correct extraction of elemental and isotopic depth profiles from the measured spectra, but already prior to data acquisition, in optimising experimental conditions to reach the required depth resolution at a certain depth. After a short review of the literature on the different energy spread contributions experimental examples are given from resonance, RBS, elastic BS and ERDA practice in which an account for energy spread contributions is essential. Some further examples illustrate extraction of structural information (roughness, pore size, etc.) from elaborated depth resolution calculation for such layer structures

Energy spread in ion beam analysis

Energy Technology Data Exchange (ETDEWEB)

Szilagyi, E. E-mail: szilagyi@rmki.kkfki.hu

2000-03-01

In ion beam analysis (IBA) the depth profiles are extracted from the experimentally determined energy profiles. The spectra, however, are subject to finite energy resolution of both extrinsic and intrinsic origin. Calculation of those effects such as instrumental beam, geometry and detection-related energy and angular spreads as well as energy straggling, multiple scattering and Doppler effects in the sample itself is not trivial, especially since it involves treatment of non-independent random processes. A proper account for energy spread is vital in IBA not only for correct extraction of elemental and isotopic depth profiles from the measured spectra, but already prior to data acquisition, in optimising experimental conditions to reach the required depth resolution at a certain depth. After a short review of the literature on the different energy spread contributions experimental examples are given from resonance, RBS, elastic BS and ERDA practice in which an account for energy spread contributions is essential. Some further examples illustrate extraction of structural information (roughness, pore size, etc.) from elaborated depth resolution calculation for such layer structures.

Generation of monoenergetic ion beams via ionization dynamics (Conference Presentation)

Science.gov (United States)

Lin, Chen; Kim, I. Jong; Yu, Jinqing; Choi, Il Woo; Ma, Wenjun; Yan, Xueqing; Nam, Chang Hee

2017-05-01

The research on ion acceleration driven by high intensity laser pulse has attracted significant interests in recent decades due to the developments of laser technology. The intensive study of energetic ion bunches is particularly stimulated by wide applications in nuclear fusion, medical treatment, warm dense matter production and high energy density physics. However, to implement such compact accelerators, challenges are still existing in terms of beam quality and stability, especially in applications that require higher energy and narrow bandwidth spectra ion beams. We report on the acceleration of quasi-mono-energetic ion beams via ionization dynamics in the interaction of an intense laser pulse with a solid target. Using ionization dynamics model in 2D particle-in-cell (PIC) simulations, we found that high charge state contamination ions can only be ionized in the central spot area where the intensity of sheath field surpasses their ionization threshold. These ions automatically form a microstructure target with a width of few micron scale, which is conducive to generate mono-energetic beams. In the experiment of ultraintense (< 10^21 W/cm^2) laser pulses irradiating ultrathin targets each attracted with a contamination layer of nm-thickness, high quality < 100 MeV mono-energetic ion bunches are generated. The peak energy of the self-generated micro-structured target ions with respect to different contamination layer thickness is also examined This is relatively newfound respect, which is confirmed by the consistence between experiment data and the simulation results.

Reaching for highest ion beam intensities through laser ion acceleration and beam compression

Energy Technology Data Exchange (ETDEWEB)

Schumacher, Dennis; Brabetz, Christian; Blazevic, Abel; Bagnoud, Vincent; Weih, Simon [GSI Helmholtzzentrum fuer Schwerionenforschung (Germany); Jahn, Diana; Ding, Johannes; Roth, Markus [TU Darmstadt (Germany); Kroll, Florian; Schramm, Ulrich; Cowan, Tom [Helmholtzzentrum Dresden Rossendorf (Germany); Collaboration: LIGHT-Collaboration

2016-07-01

Laser ion acceleration provides access to ion sources with unique properties. To use these capabilities the LIGHT collaboration (Laser Ion Generation Handling and Transport) was founded. The aim of this collaboration is the beam transport and manipulation of laser accelerated ions with conventional accelerator structures. Therefor a dedicated beam line has been build up at GSI Helmholtzzentrum fuer Schwerionenforschung. With this beam line the manipulation of the transversal and also the longitudinal beam parameters has been achieved. It has been shown that laser generated ion beams can be transported over more than 6 meters and pulses shorter than 300 ps can be generated at this distance. This Talk will give an overview over the recent developments and plans of the LIGHT collaboration.

Micro structure processing on plastics by accelerated hydrogen molecular ions

Science.gov (United States)

Hayashi, H.; Hayakawa, S.; Nishikawa, H.

2017-08-01

A proton has 1836 times the mass of an electron and is the lightest nucleus to be used for accelerator in material modification. We can setup accelerator with the lowest acceleration voltage. It is preferable characteristics of Proton Beam Writer (PBW) for industrial applications. On the contrary ;proton; has the lowest charge among all nuclei and the potential impact to material is lowest. The object of this research is to improve productivity of the PBW for industry application focusing on hydrogen molecular ions. These ions are generated in the same ion source by ionizing hydrogen molecule. There is no specific ion source requested and it is suitable for industrial use. We demonstrated three dimensional (3D) multilevel micro structures on polyester base FPC (Flexible Printed Circuits) using proton, H2+ and H3+. The reactivity of hydrogen molecular ions is much higher than that of proton and coincident with the level of expectation. We can apply this result to make micro devices of 3D multilevel structures on FPC.

Development of focused ion beam systems with various ion species

International Nuclear Information System (INIS)

Ji Qing; Leung, K.-N.; King, Tsu-Jae; Jiang Ximan; Appleton, Bill R.

2005-01-01

Conventional focused ion beam systems employ a liquid-metal ion source (LMIS) to generate high-brightness beams, such as Ga + beams. Recently there has been an increased need for focused ion beams in areas like biological studies, advanced magnetic-film manufacturing and secondary-ion mass spectroscopy (SIMS). In this article, status of development on focused ion beam systems with ion species such as O 2 + , P + , and B + will be reviewed. Compact columns for forming focused ion beams from low energy (∼3keV), to intermediate energy (∼35keV) are discussed. By using focused ion beams, a SOI MOSFET is fabricated entirely without any masks or resist

Beam brilliance investigation of high current ion beams at GSI heavy ion accelerator facility.

Science.gov (United States)

Adonin, A A; Hollinger, R

2014-02-01

In this work the emittance measurements of high current Ta-beam provided by VARIS (Vacuum Arc Ion Source) ion source are presented. Beam brilliance as a function of beam aperture at various extraction conditions is investigated. Influence of electrostatic ion beam compression in post acceleration gap on the beam quality is discussed. Use of different extraction systems (single aperture, 7 holes, and 13 holes) in order to achieve more peaked beam core is considered. The possible ways to increase the beam brilliance are discussed.

In situ ion-beam analysis and modification of sol-gel zirconia thin films

International Nuclear Information System (INIS)

Levine, T.E.; Mayer, J.W.

1995-01-01

We report the investigation of ion-beam-induced densification of sol-gel zirconia thin films via in situ ion backscattering spectrometry. We have irradiated three regions of a sample with neon, argon, and krypton ions. For each ion species, a series of irradiation and analysis steps were performed using an interconnected 3 MV tandem accelerator. The technique offers the advantages of minimizing the variation of experimental parameters and sequentially monitoring the densification phenomenon with increasing ion dose

Application of ion mobility-mass spectrometry to microRNA analysis.

Science.gov (United States)

Takebayashi, Kosuke; Hirose, Kenji; Izumi, Yoshihiro; Bamba, Takeshi; Fukusaki, Eiichiro

2013-03-01

Liquid chromatography/mass spectrometry is widely used for studying sequence determination and modification analysis of small RNAs. However, the efficiency of liquid chromatography-based separation of intact small RNA species is insufficient, since the physiochemical properties among small RNAs are very similar. In this study, we focused on ion mobility-mass spectrometry (IM-MS), which is a gas-phase separation technique coupled with mass spectrometry; we have evaluated the utility of IM-MS for microRNA (miRNA) analysis. A multiply charged deprotonated ion derived from an 18-24-nt-long miRNA was formed by electrospray ionization, and then the time, called the "drift time", taken by each ion to migrate through a buffer gas was measured. Each multivalent ion was temporally separated on the basis of the charge state and structural formation; 3 types of unique mass-mobility correlation patterns (i.e., chainlike-form, hairpin-form, and dimer-form) were present on the two-dimensional mobility-mass spectrum. Moreover, we found that the ion size (sequence length) and the secondary structures of the small RNAs strongly contributed to the IM-MS-based separation, although solvent conditions such as pH had no effect. Therefore, sequence isomers could also be discerned by the selection of each specific charged ion, i.e., the 6(-) charged ion reflected a majority among chainlike-, hairpin-, and other structures. We concluded that the IM-MS provides additional capability for separation; thus, this analytical method will be a powerful tool for comprehensive small RNA analysis. Copyright © 2012. Published by Elsevier B.V.

A fast beam-ion instability

Energy Technology Data Exchange (ETDEWEB)

Stupakov, G V [Stanford Linear Accelerator Center, Menlo Park, CA (United States)

1996-08-01

The ionization of residual gas by an electron beam in an accelerator generates ions that can resonantly couple to the beam through a wave propagating in the beam-ion system. Results of the study of a beam-ion instability are presented for a multi-bunch train taking into account the decoherence of ion oscillations due to the ion frequency spread and spatial variation of the ion frequency. It is shown that the combination of both effects can substantially reduce the growth rate of the instability. (author)

Kinetic plasma simulation of ion beam extraction from an ECR ion source

International Nuclear Information System (INIS)

Elliott, S.M.; White, E.K.; Simkin, J.

2012-01-01

Designing optimized ECR (electron cyclotron resonance) ion beam sources can be streamlined by the accurate simulation of beam optical properties in order to predict ion extraction behavior. The complexity of these models, however, can make PIC-based simulations time-consuming. In this paper, we first describe a simple kinetic plasma finite element simulation of extraction of a proton beam from a permanent magnet hexapole ECR ion source. Second, we analyze the influence of secondary electrons generated by ion collisions in the residual gas on the space charge of a proton beam of a dual-solenoid ECR ion source. The finite element method (FEM) offers a fast modeling environment, allowing analysis of ion beam behavior under conditions of varying current density, electrode potential, and gas pressure. The new version of SCALA/TOSCA v14 permits the making of simulations in tens of minutes to a few hours on standard computer platforms without the need of particle-in-cell methods. The paper is followed by the slides of the presentation. (authors)

Buckling analysis of micro- and nano-rods/tubes based on nonlocal Timoshenko beam theory

International Nuclear Information System (INIS)

Wang, C M; Zhang, Y Y; Ramesh, Sai Sudha; Kitipornchai, S

2006-01-01

This paper is concerned with the elastic buckling analysis of micro- and nano-rods/tubes based on Eringen's nonlocal elasticity theory and the Timoshenko beam theory. In the former theory, the small scale effect is taken into consideration while the effect of transverse shear deformation is accounted for in the latter theory. The governing equations and the boundary conditions are derived using the principle of virtual work. Explicit expressions for the critical buckling loads are derived for axially loaded rods/tubes with various end conditions. These expressions account for a better representation of the buckling behaviour of micro- and nano-rods/tubes where small scale effect and transverse shear deformation effect are significant. By comparing it with the classical beam theories, the sensitivity of the small scale effect on the buckling loads may be observed

Neutralized ion beam modification of cellulose membranes for study of ion charge effect on ion-beam-induced DNA transfer

Science.gov (United States)

Prakrajang, K.; Sangwijit, K.; Anuntalabhochai, S.; Wanichapichart, P.; Yu, L. D.

2012-02-01

Low-energy ion beam biotechnology (IBBT) has recently been rapidly developed worldwide. Ion-beam-induced DNA transfer is one of the important applications of IBBT. However, mechanisms involved in this application are not yet well understood. In this study plasma-neutralized ion beam was applied to investigate ion charge effect on induction of DNA transfer. Argon ion beam at 7.5 keV was neutralized by RF-driven plasma in the beam path and then bombarded cellulose membranes which were used as the mimetic plant cell envelope. Electrical properties such as impedance and capacitance of the membranes were measured after the bombardment. An in vitro experiment on plasmid DNA transfer through the cellulose membrane was followed up. The results showed that the ion charge input played an important role in the impedance and capacitance changes which would affect DNA transfer. Generally speaking, neutral particle beam bombardment of biologic cells was more effective in inducing DNA transfer than charged ion beam bombardment.

Development of a beam ion velocity detector for the heavy ion beam probe

International Nuclear Information System (INIS)

Fimognari, P. J.; Crowley, T. P.; Demers, D. R.

2016-01-01

In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

Development of a beam ion velocity detector for the heavy ion beam probe

Energy Technology Data Exchange (ETDEWEB)

Fimognari, P. J., E-mail: PJFimognari@XanthoTechnologies.com; Crowley, T. P.; Demers, D. R. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

Study of squeeze film damping in a micro-beam resonator based on micro-polar theory

Directory of Open Access Journals (Sweden)

Mina Ghanbari

Full Text Available In this paper, squeeze film damping in a micro-beam resonator based on micro-polar theory has been investigated. The proposed model for this study consists of a clamped-clamped micro-beam bounded between two fixed layers. The gap between the micro-beam and layers is filled with air. As fluid behaves differently in micro scale than macro, the micro-scale fluid field in the gap has been modeled based on micro-polar theory. Equation of motion governing transverse deflection of the micro- beam based on modified couple stress theory and also non-linear Reynolds equation of the fluid field based on micropolar theory have been non-dimensionalized, linearized and solved simultaneously in order to calculate the quality factor of the resonator. The effect of micropolar parameters of air on the quality factor has been investigated. The quality factor of the of the micro-beam resonator for different values of non-dimensionalized length scale of the beam, squeeze number and also non-dimensionalized pressure has been calculated and compared to the obtained values of quality factor based on classical theory.

Undergraduate Research and Training in Ion-Beam Analysis of Environmental Materials

Science.gov (United States)

Vineyard, Michael F.; Chalise, Sajju; Clark, Morgan L.; LaBrake, Scott M.; McCalmont, Andrew M.; McGuire, Brendan C.; Mendez, Iseinie I.; Watson, Heather C.; Yoskowitz, Joshua T.

We have an active undergraduate research program at the Union College Ion-Beam Analysis Laboratory (UCIBAL) focused on the study of environmental materials. Accelerator-based ion-beam analysis (IBA) is a powerful tool for the study of environmental pollution because it can provide information on a broad range of elements with high sensitivity and low detection limits, is non-destructive, and requires little or no sample preparation. It also provides excellent training for the next generation of environmental scientists. Beams of protons and alpha particles with energies of a few MeV from the 1.1-MV tandem Pelletron accelerator (NEC Model 3SDH) in the UCIBAL are used to characterize environmental samples using IBA techniques such as proton-induced X-ray emission, Rutherford back-scattering, and proton-induced gamma-ray emission. Recent projects include the characterization of atmospheric aerosols in the Adirondack Mountains of upstate New York, the study of heavy metal pollutants in river sediment, measurements of Pb diffusion in sulfide minerals to help constrain the determination of the age of iron meteorites, and the search for heavy metals and toxins in artificial turf.

Resonance ionization mass spectrometry of ion beam sputtered neutrals for element- and isotope-selective analysis of plutonium in micro-particles

Energy Technology Data Exchange (ETDEWEB)

Erdmann, N. [Institute for Transuranium Elements, European Commission Joint Research Centre, Karlsruhe (Germany); Kratz, J.V.; Trautmann, N. [Johannes Gutenberg-University Mainz, Institute of Nuclear Chemistry, Mainz (Germany); Passler, G. [Johannes Gutenberg-University Mainz, Institute of Physics, Mainz (Germany)

2009-11-15

Micro-particles containing actinides are of interest for risk assessments of contaminated areas, nuclear forensic analyses, and IAEA as well as Euratom safeguards programs. For their analysis, secondary ion mass spectrometry (SIMS) has been established as the state-of-the-art standard technique. In the case of actinide mixtures within the particles, however, SIMS suffers from isobaric interferences (e.g., {sup 238}U/{sup 238}Pu, {sup 241}Am/{sup 241}Pu). This can be eliminated by applying resonance ionization mass spectrometry which is based on stepwise resonant excitation and ionization of atoms with laser light, followed by mass spectrometric detection of the produced ions, combining high elemental selectivity with the analysis of isotopic compositions. This paper describes the instrumental modifications for coupling a commercial time-of-flight (TOF)-SIMS apparatus with three-step resonant post-ionization of the sputtered neutrals using a high-repetition-rate (kHz) Nd:YAG laser pumped tunable titanium:sapphire laser system. Spatially resolved ion images obtained from actinide-containing particles in TOF-SIMS mode demonstrate the capability for isotopic and spatial resolution. Results from three-step resonant post-ionization of bulk Gd and Pu samples successfully demonstrate the high elemental selectivity of this process. (orig.)

A specialized bioengineering ion beam line

International Nuclear Information System (INIS)

Yu, L.D.; Sangyuenyongpipat, S.; Sriprom, C.; Thongleurm, C.; Suwanksum, R.; Tondee, N.; Prakrajang, K.; Vilaithong, T.; Brown, I.G.; Wiedemann, H.

2007-01-01

A specialized bioengineering ion beam line has recently been completed at Chiang Mai University to meet rapidly growing needs of research and application development in low-energy ion beam biotechnology. This beam line possesses special features: vertical main beam line, low-energy (30 keV) ion beams, double swerve of the beam, a fast pumped target chamber, and an in-situ atomic force microscope (AFM) system chamber. The whole beam line is situated in a bioclean environment, occupying two stories. The quality of the ion beam has been studied. It has proved that this beam line has significantly contributed to our research work on low-energy ion beam biotechnology

DESIGN of MICRO CANTILEVER BEAM for VAPOUR DETECTION USING COMSOL MULTI PHYSICS SOFTWARE

OpenAIRE

Sivacoumar R; Parvathy JM; Pratishtha Deep

2015-01-01

This paper gives an overview of micro cantilever beam of various shapes and materials for vapour detection. The design of micro cantilever beam, analysis and simulation is done for each shape. The simulation is done using COMSOL Multi physics software using structural mechanics and chemical module. The simulation results of applied force and resulting Eigen frequencies will be analyzed for different beam structures. The vapour analysis is done using flow cell that consists of chemical pill...

Materials analysis fast ions

CERN Document Server

Denker, A; Rauschenberg, J; Röhrich, J; Strub, E

2006-01-01

Materials analysis with ion beams exploits the interaction of ions with the electrons and nuclei in the sample. Among the vast variety of possible analytical techniques available with ion beams we will restrain to ion beam analysis with ion beams in the energy range from one to several MeV per mass unit. It is possible to use either the back-scattered projectiles (RBS – Rutherford Back Scattering) or the recoiled atoms itself (ERDA – Elastic Recoil Detection Analysis) from the elastic scattering processes. These techniques allow the simultaneous and absolute determination of stoichiometry and depth profiles of the detected elements. The interaction of the ions with the electrons in the sample produces holes in the inner electronic shells of the sample atoms, which recombine and emit X-rays characteristic for the element in question. Particle Induced X-ray Emission (PIXE) has shown to be a fast technique for the analysis of elements with an atomic number above 11.

Potential clinical impact of laser-accelerated beams in cancer ion therapy

Energy Technology Data Exchange (ETDEWEB)

Obcemea, Ceferino

2016-09-01

In this article, I present three advantages of plasma-accelerated ion beams for cancer therapy. I discuss how: 1. low-emittance and well-collimated beams are advantageous in proximal normal tissue-sparing; 2. highly-peaked quasi-monoenergetic beams are ideal for fast energy selection and switching in Pencil Beam Scanning (PBS) as a treatment delivery; 3. high fluence and ultra-short pulse delivery produce collective excitations in the medium and enhance the stopping power. This in turn produces denser ionization track signatures (spurs, blobs, etc.) in target tumors, higher linear energy transfer, higher Bragg peak, and higher radiobiological effectiveness at the micro-level.

Ion beams from high-current PF facilities

Energy Technology Data Exchange (ETDEWEB)

Sadowski, M [Soltan Inst. for Nuclear Studies, Otwock-Swierk (Poland)

1997-12-31

Pulsed beams of fast deuterons and impurity or admixture ions emitted from high-current PF-type facilities operated in different laboratories are dealt with. A short comparative analysis of time-integrated and time-resolved studies is presented. Particular attention is paid to the microstructure of such ion beams, and to the verification of some theoretical models. (author). 5 figs., 19 refs.

Analysis of strain error sources in micro-beam Laue diffraction

International Nuclear Information System (INIS)

Hofmann, Felix; Eve, Sophie; Belnoue, Jonathan; Micha, Jean-Sébastien; Korsunsky, Alexander M.

2011-01-01

Micro-beam Laue diffraction is an experimental method that allows the measurement of local lattice orientation and elastic strain within individual grains of engineering alloys, ceramics, and other polycrystalline materials. Unlike other analytical techniques, e.g. based on electron microscopy, it is not limited to surface characterisation or thin sections, but rather allows non-destructive measurements in the material bulk. This is of particular importance for in situ loading experiments where the mechanical response of a material volume (rather than just surface) is studied and it is vital that no perturbation/disturbance is introduced by the measurement technique. Whilst the technique allows lattice orientation to be determined to a high level of precision, accurate measurement of elastic strains and estimating the errors involved is a significant challenge. We propose a simulation-based approach to assess the elastic strain errors that arise from geometrical perturbations of the experimental setup. Using an empirical combination rule, the contributions of different geometrical uncertainties to the overall experimental strain error are estimated. This approach was applied to the micro-beam Laue diffraction setup at beamline BM32 at the European Synchrotron Radiation Facility (ESRF). Using a highly perfect germanium single crystal, the mechanical stability of the instrument was determined and hence the expected strain errors predicted. Comparison with the actual strain errors found in a silicon four-point beam bending test showed good agreement. The simulation-based error analysis approach makes it possible to understand the origins of the experimental strain errors and thus allows a directed improvement of the experimental geometry to maximise the benefit in terms of strain accuracy.

Spatially-Resolved Ion Trajectory Measurements During Cl2 Reactive Ion Beam Etching and Ar Ion Beam Etching

International Nuclear Information System (INIS)

Vawter, G. Allen; Woodworth, Joseph R.; Zubrzycki, Walter J.

1999-01-01

The angle of ion incidence at the etched wafer location during RIBE and IBE using Cl 2 , Ar and O 2 ion beams has been characterized using an ion energy and angle analyzer. Effects of beam current and accelerator grid bias on beam divergence and the spatial uniformity of the spread of incident angles are measured. It is observed that increased total beam current can lead to reduced current density at the sample stage due to enhanced beam divergence at high currents. Results are related to preferred etch system design for uniform high-aspect-ratio etching across semiconductor wafers

Sawtooth activity of the ion cloud in an electron-beam ion trap

International Nuclear Information System (INIS)

Radtke, R.; Biedermann, C.

2003-01-01

The dynamics of an ensemble of highly charged Ar and Ba ions in an electron-beam ion trap (EBIT) was studied by recording time-resolved x-ray spectra emitted from trapped ions. Sawtoothlike signatures manifest in the spectra for a variety of EBIT operating conditions indicating a sudden collapse of the ion inventory in the trap. The collapse occurs on a time scale of approximately 100 ms and the evolution of the sawteeth is very sensitive to parameters such as electron-beam current and axial trap depth. Analysis of the measurements is based on a time-dependent calculation of the trapping process showing that sawtooth activity is caused by the feedback between the low-Z argon and high-Z barium ions. This unexpected behavior demonstrates the importance of nonlinear effects in electron-beam traps containing more than a single ion species

The role of space charge compensation for ion beam extraction and ion beam transport (invited)

International Nuclear Information System (INIS)

Spädtke, Peter

2014-01-01

Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation

Ions kinematics in an electrostatic ion beam trap

Energy Technology Data Exchange (ETDEWEB)

Attia, D

2004-06-01

In this study, I have tried to provide a better understanding of the dynamics of ions inside an electrostatic ion beam trap. The electrostatic ion trap allows to store ions moving between two electrostatic mirrors. Although the trap has been developed already seven years ago, no direct measurement of the transversal velocity distribution of the ions has been performed. Such quantity is central for understanding the conditions under which a beam should be produced (mainly emittance) in order to be trapped by such a device. The data I have obtained during the course of this work are based on an experimental technique which relies on the direct imaging of the particles exiting the trap, as well as on numerical simulations of the ion trajectories inside the trap. I have personally been involved in the hardware development of the imaging system, the data acquisition and analysis of the data as well as il all numerical calculations presented here. These results allow us to obtain, for the first time, experimental information on the transverse phase space of the trap, and contribute to the overall understanding of the ion motion in this system. (author)

Parameters affecting profile shape of a high energy low current thin ion beam. Vol. 2

Energy Technology Data Exchange (ETDEWEB)

Abdel Salam, F W; Moustafa, O A; El-Khabeary, H [Accelerators Department, Nuclear Research Center, Atomic Energy Authority, Cairo, (Egypt)

1996-03-01

The shape of the profile of a high energy, low current beam of finite length has beam investigated. The beam profile shape depends on the initial beam radius, beam perveance, atomic mass number, charge state of ions, and beam length. These parameters can affect the relation between the initial beam radius and the corresponding final one. An optimum initial beam radius corresponding to minimum final beam at the target has been formulated and the relation between them is deduced taking account of the space charge effect. The minimum beam radius at the target was found to be equal to 2.3 of the optimum initial radius. It is concluded that in order to obtain a small beam radius at a target placed at a finite distance from an ion source, a beam of a low perveance, low atomic mass number and high number of electronic charge is required. This is an important detection for micro machining applications using the oscillating electron ion source which produces nearly paraxial thin beam of low perveance. 12 figs.

Investigation of chemical vapour deposition diamond detectors by X-ray micro-beam induced current and X-ray micro-beam induced luminescence techniques

International Nuclear Information System (INIS)

Olivero, P.; Manfredotti, C.; Vittone, E.; Fizzotti, F.; Paolini, C.; Lo Giudice, A.; Barrett, R.; Tucoulou, R.

2004-01-01

Tracking detectors have become an important ingredient in high-energy physics experiments. In order to survive the harsh detection environment of the large hadron collider (LHC), trackers need to have special properties. They must be radiation hard, provide fast collection of charge, be as thin as possible and remove heat from readout electronics. The unique properties of diamond allow it to fulfill these requirements. In this work we present an investigation of the charge transport and luminescence properties of 'detector grade' artificial chemical vapour deposition (CVD) diamond devices developed within the CERN RD42 collaboration, performed by means of X-ray micro-beam induced current collection (XBICC) and X-ray micro-beam induced luminescence (XBIL) techniques. XBICC technique allows quantitative estimates of the transport parameters of the material to be evaluated and mapped with micrometric spatial resolution. In particular, the high resolution and sensitivity of the technique has allowed a quantitative study of the inhomogeneity of the charge transport parameter defined as the product of mobility and lifetime for both electron and holes. XBIL represents a technique complementary to ion beam induced luminescence (IBIL), which has already been used by our group, since X-ray energy loss profile in the material is different from that of MeV ions. X-ray induced luminescence maps have been performed simultaneously with induced photocurrent maps, to correlate charge transport and induced luminescence properties of diamond. Simultaneous XBICC and XBIL maps exhibit features of partial complementarity that have been interpreted on the basis of considerations on radiative and non-radiative recombination processes which compete with charge transport efficiency

Isotope analysis of micro metal particles by adopting laser-ablation mass spectrometry

International Nuclear Information System (INIS)

Song, Kyu Seok; Ha, Young Kyung; Han, Sun Ho; Park, Yong Joon; Kim, Won Ho

2005-01-01

The isotope analysis of microparticles in environmental samples as well as laboratory samples is an important task. A special concern is necessary in particle analysis of swipe samples. Micro particles are normally analyzed either by dissolving particles in the solvents and adopting conventional analytical methods or direct analysis method such as a laser-ablation ICP mass spectrometry (LA-ICP-MS), SIMS, and SNMS (sputtered neutral mass spectrometry). But the LA-ICPMS uses large amount of samples because normally laser beam is tightly focused on the target particle for the complete ablation. The SIMS and SNMS utilize ion beams for the generation of sample ions from the particle. But the number of ions generated by an ion beam is less than 5% of the total generated particles in SIMS. The SNMS is also an excellent analytical technique for particle analysis, however, ion beam and frequency tunable laser system are required for the analysis. Recently a direct analysis of elements as well as isotopes by using laser-ablation is recognized one of the most efficient detection technology for particle samples. The laser-ablation mass spectrometry requires only one laser source without frequency tuneability with no sample pretreatment. Therefore this technique is one of the simplest analysis techniques for solid samples as well as particles. In this study as a part of the development of the new isotope analysis techniques for particles samples, a direct laser-ablation is adopted with mass spectrometry. Zinc and gadolinium were chosen as target samples, since these elements have isotopes with minor abundance (0.62% for Zn, and 0.2% for Gd). The preliminary result indicates that isotopes of these two elements are analyzed within 10% of natural abundance with good mass resolution by using direct laser-ablation mass spectrometry

Ion beam generation and focusing

International Nuclear Information System (INIS)

Miller, P.A.; Mendel, C.W.; Swain, D.W.; Goldstein, S.A.

1975-01-01

Calculations have shown that efficiently generated and focused ion beams could have significant advantages over electron beams in achieving ignition of inertially-confined thermonuclear fuel. Efficient ion beam generation implies use of a good ion source and suppression of net electron current. Net electron flow can be reduced by allowing electrons to reflex through a highly transparent anode or by use of transverse magnetic fields (either beam self-fields or externally applied fields). Geometric focusing can be achieved if the beam is generated by appropriately shaped electrodes. Experimental results are presented which demonstrate ion beam generation in both reflexing and pinched-flow diodes. Spherically shaped electrodes are used to concentrate a proton beam, and target response to proton deposition is studied

Analysis and modification of blue sapphires from Rwanda by ion beam techniques

International Nuclear Information System (INIS)

Bootkul, D.; Chaiwai, C.; Tippawan, U.; Wanthanachaisaeng, B.; Intarasiri, S.

2015-01-01

Highlights: • Ion beam analysis is an effective method for detecting trace elements. • Ion beam treatment is able to improve optical and color appearances of the blue sapphire from Rwanda. • These alternative methods can be extended to jewelry industry for large scale application. - Abstract: Blue sapphire is categorised in a corundum (Al_2O_3) group. The gems of this group are always amazed by their beauties and thus having high value. In this study, blue sapphires from Rwanda, recently came to Thai gemstone industry, are chosen for investigations. On one hand, we have applied Particle Induced X-ray Emission (PIXE), which is a highly sensitive and precise analytical technique that can be used to identify and quantify trace elements, for chemical analysis of the sapphires. Here we have found that the major element of blue sapphires from Rwanda is Al with trace elements such as Fe, Ti, Cr, Ga and Mg as are commonly found in normal blue sapphire. On the other hand, we have applied low and medium ion implantations for color improvement of the sapphire. It seems that a high amount of energy transferring during cascade collisions have altered the gems properties. We have clearly seen that the blue color of the sapphires have been intensified after nitrogen ion bombardment. In addition, the gems were also having more transparent and luster. The UV–Vis–NIR measurement detected the modification of their absorption properties, implying of the blue color increasing. Here the mechanism of these modifications is postulated and reported. In any point of view, the bombardment by using nitrogen ion beam is a promising technique for quality improvement of the blue sapphire from Rwanda.

Ion accumulation and space charge neutralization in intensive electron beams for ion sources and electron cooling

International Nuclear Information System (INIS)

Shirkov, G.D.

1996-01-01

The Electron Beam Ion Sources (EBIS), Electron Beam Ion Traps (EBIT) and electron beams for electron cooling application have the beam parameters in the same ranges of magnitudes. EBIS and EBIT produce and accumulate ions in the beam due to electron impact ionization. The cooling electron beam accumulates positive ions from the residual gas in the accelerator chamber during the cooling cycle. The space charge neutralization of cooling beam is also used to reduce the electron energy spread and enhance the cooling ability. The advanced results of experimental investigations and theoretical models of the EBIS electron beams are applied to analyze the problem of beam neutralization in the electron cooling techniques. The report presents the analysis of the most important processes connected with ion production, accumulation and losses in the intensive electron beams of ion sources and electron cooling systems for proton and ion colliders. The inelastic and elastic collision processes of charged particles in the electron beams are considered. The inelastic processes such as ionization, charge exchange and recombination change the charge states of ions and neutral atoms in the beam. The elastic Coulomb collisions change the energy of particles and cause the energy redistribution among components in the electron-ion beams. The characteristic times and specific features of ionization, beam neutralization, ion heating and loss in the ion sources and electron cooling beams are determined. The dependence of negative potential in the beam cross section on neutralization factor is studied. 17 refs., 5 figs., 1 tab

Improved Light Extraction Efficiency by Photonic Crystal Arrays on Transparent Contact Layer Using Focused Ion Beams

International Nuclear Information System (INIS)

Wu, G.M.; Tsai, B.H.; Kung, S.F.; Wu, C.F.

2011-01-01

Nitride-based thin-film materials have become increasingly important for the high brightness light-emitting diode applications. The improvements in light extraction and lower power consumption are highly desired. Although the internal quantum efficiency of GaN-based LED has been relatively high, only a small fraction of light can be extracted. In this study, a new design of two-dimensional photonic crystal array has been prepared on the top transparent contact layer of indium-tin oxide film to improve the light extraction efficiency using focused ion beam. The acceleration voltage of the Ga dual-beam nanotechnology system SMI 3050 was 30 kV and the ion beam current was 100 pA. The cylindrical air holes had the diameter of 150 nm and depth of 100 nm. The micro photoluminescence analysis results showed that the light output intensity could be 1.5 times of that of the non-patterned control sample. In addition, the structural damage from the focused ion beam drilling of GaN step could be eliminated. The excellent I-V characteristics have been maintained, and the external light extraction efficiency would be still improved for the LED devices. (author)

Ion-Beam-Excited Electrostatic Ion Cyclotron Waves

DEFF Research Database (Denmark)

Michelsen, Poul; Pécseli, Hans; Juul Rasmussen, Jens

1976-01-01

Self-excited electrostatic ion cyclotron waves were observed in an ion-beam-plasma system produced in a DP-operated Q-machine. The frequency of the waves showed the theoretically predicted variation with the magnetic field.......Self-excited electrostatic ion cyclotron waves were observed in an ion-beam-plasma system produced in a DP-operated Q-machine. The frequency of the waves showed the theoretically predicted variation with the magnetic field....

Low energy ion beam dynamics of NANOGAN ECR ion source

Energy Technology Data Exchange (ETDEWEB)

Kumar, Sarvesh, E-mail: sarvesh@iuac.res.in; Mandal, A.

2016-04-01

A new low energy ion beam facility (LEIBF) has been developed for providing the mass analyzed highly charged intense ion beams of energy ranging from a few tens of keV to a few MeV for atomic, molecular and materials sciences research. The new facility consists of an all permanent magnet 10 GHz electron cyclotron resonance (ECR) ion source (NANOGAN) installed on a high voltage platform (400 kV) which provides large currents of multiply charged ion beams. Higher emittance at low energy of intense ion beam puts a tremendous challenge to the beam optical design of this facility. The beam line consists of mainly the electrostatic quadrupoles, an accelerating section, analyzing cum switching magnet and suitable beam diagnostics including vacuum components. The accelerated ion beam is analyzed for a particular mass to charge (m/q) ratio as well as guided to three different lines along 75°, 90° and 105° using a large acceptance analyzing cum switching magnet. The details of transverse beam optics to all the beam lines with TRANSPORT and GICOSY beam optics codes are being described. Field computation code, OPERA 3D has been utilized to design the magnets and electrostatic quadrupoles. A theoretical estimation of emittance for optimized geometry of ion source is given so as to form the basis of beam optics calculations. The method of quadrupole scan of the beam is used to characterize the emittance of the final beam on the target. The measured beam emittance increases with m/q ratios of various ion beams similar to the trend observed theoretically.

Fusion at counterstreaming ion beams - ion optic fusion (IOF)

International Nuclear Information System (INIS)

Gryzinski, M.

1981-01-01

The results of investigation are briefly reviewed in the field of ion optic fusion performed at the Institute of Nuclear Research in Swierk. The ion optic fusion concept is based on the possibility of obtaining fusion energy at highly ordered motion of ions in counterstreaming ion beams. For this purpose TW ion beams must be produced and focused. To produce dense and charge-neutralized ion beams the selective conductivity and ballistic focusing ideas were formulated and used in a series of RPI devices with low-pressure cylindrical discharge between grid-type electrodes. 100 kA, 30 keV deuteron beams were successfully produced and focused into the volume of 1 cm 3 , yielding 10 9 neutrons per 200 ns shot on a heavy ice target. Cylindrically convergent ion beams with magnetic anti-defocusing were proposed in order to reach a positive energy gain at reasonable energy level. (J.U.)

Ion beam analysis of thin films. Applications to porous silicon

International Nuclear Information System (INIS)

Ortega, C.; Grosman, A.; Morazzani, V.

1995-01-01

The aim of this paper is twofold: (1)- to present a summary of the fundamental interactions between ion beam (such as proton, deuteron or helium) of MeV energy and solids, interactions that are used in material analysis techniques such as Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA) and Nuclear Reaction Analysis (NRA), and (2)- to illustrate the use of these techniques to determine the composition of the surface and outer microns of material. Some examples will be given concerning porous silicon layers. (authors). 38 refs., 25 figs., 3 tabs

Gene-expression profiling after exposure to C-ion beams

International Nuclear Information System (INIS)

Saegusa, Kumiko; Furuno, Aki; Ishikawa, Kenichi; Ishikawa, Atsuko; Ohtsuka, Yoshimi; Kawai, Seiko; Imai, Takashi; Nojima, Kumie

2005-01-01

It is recognized that carbon-ion beam kills cancer cells more efficiently than X-ray. In this study we have compared cellular gene expression response after carbon-ion beam exposure with that after X-ray exposure. Gene expression profiles of cultured neonatal human dermal fibroblasts (NHDF) at 0, 1, 3, 6, 12, 18, and 24 hr after exposure to 0.1, 2 and 5 Gy of X-ray or carbon-ion beam were obtained using 22K oligonucleotide microarray. N-way ANOVA analysis of whole gene expression data sets selected 960 genes for carbon-ion beam and 977 genes for X-ray, respectively. Interestingly, majority of these genes (91% for carbon-ion beam and 88% for X-ray, respectively) were down regulated. The selected genes were further classified by their dose-dependence or time-dependence of gene expression change (fold change>1.5). It was revealed that genes involved in cell proliferation had tendency to show time-dependent up regulation by carbon-ion beam. Another N-way ANOVA analysis was performed to select 510 genes, and further selection was made to find 70 genes that showed radiation species-dependent gene expression change (fold change>1.25). These genes were then categorized by the K-Mean clustering method into 4 clusters. Each cluster showed tendency to contain genes involved in cell cycle regulation, cell death, responses to stress and metabolisms, respectively. (author)

Development of ion beam sputtering technology for mold and die

International Nuclear Information System (INIS)

Lee, Jaehyung; Park, J.; Lee, J.; Jil, J.; Yang, D.; Noh, Y.; You, B.; You, J.

2003-06-01

Ion beam sputtering technique, one of the surface modification techniques, is to reduce surface roughness of materials with selective detaching atoms and micro particles from the surface by bombarding energetic ions of a few to a few tens keV onto the materials surfaces. This technique can be applied for the surfaces that need to have sub micrometer surface roughness, and it has already been used by companies and/or Institute over the world. Although this is relatively high cost process, it has been widely demanded in the industries with developing the eco-friend equipment due to its high quality of products. In the domestic industry, it has been pointed out that the mechanical polishing technique for molds and dies is relatively expensive and does not produce the required surface roughness. Therefore, in this R and D, techniques obtained from the ion source and the ion beam irradiation techniques developed for the proton accelerator has been applied to polish the surface of molds and dies to solve the above-mentioned problems that take place during mechanical polishing. In case that ion beam polishing technique is used, we expect not only producing the high quality polished surfaces but also producing the economically valuable end-products. In this R and D project, we are aiming at establishing ion beam techniques for industrialization as well as mass production of low cost products with developing the economical instrumentation techniques. Also, as a result of this R and D it is expected that importing of precise molds and dies may be reduced and technical competitiveness will be enhanced

Ion-Ion Plasmas Produced by Electron Beams

Science.gov (United States)

Fernsler, R. F.; Leonhardt, D.; Walton, S. G.; Meger, R. A.

2001-10-01

The ability of plasmas to etch deep, small-scale features in materials is limited by localized charging of the features. The features charge because of the difference in electron and ion anisotropy, and thus one solution now being explored is to use ion-ion plasmas in place of electron-ion plasmas. Ion-ion plasmas are effectively electron-free and consist mainly of positive and negative ions. Since the two ion species behave similarly, localized charging is largely eliminated. However, the only way to produce ion-ion plasmas at low gas pressure is to convert electrons into negative ions through two-body attachment to neutrals. While the electron attachment rate is large at low electron temperatures (Te < 1 eV) in many of the halogen gases used for processing, these temperatures occur in most reactors only during the afterglow when the heating fields are turned off and the plasma is decaying. By contrast, Te is low nearly all the time in plasmas produced by electron beams, and therefore electron beams can potentially produce ion-ion plasmas continuously. The theory of ion-ion plasmas formed by pulsed electron beams is examined in this talk and compared with experimental results presented elsewhere [1]. Some general limitations of ion-ion plasmas, including relatively low flux levels, are discussed as well. [1] See the presentation by D. Leonhardt et al. at this conference.

Focused Ion Beam Analysis of Banana Peel and Its Application for Arsenate Ion Removal

Directory of Open Access Journals (Sweden)

Jamil R. Memon

2015-06-01

Full Text Available Banana peel, a common fruit waste, has been investigated for its ability to remove arsenate ions from ground water as a function of pH, contact time, and initial metal ion concentration. Focused ion beam (FIB analysis revealed the internal morphology of the banana peels. Arsenate ions were entered into micropores of banana peel. pH was seen to have no effect on the sorption process. Retained species were eluted using 5 mL of 2 M H2SO4. The kinetics of sorption were observed to follow the pseudo first order rate equation. The sorption data followed Freundlich and D-R isotherms. The energy value obtained from the D-R isotherms indicated that the sorption was physical in nature for arsenate species. Our study has shown that banana peel has the ability to remove arsenate species from ground water samples.

Focused ion beam analysis of banana peel and its application for arsenate ion removal

International Nuclear Information System (INIS)

Memon, J.R.

2015-01-01

Banana peel, a common fruit waste, has been investigated for its ability to remove arsenate ions from ground water as a function of pH, contact time, and initial metal ion concentration. Focused ion beam (FIB) analysis revealed the internal morphology of the banana peels. Arsenate ions were entered into micropores of banana peel. pH was seen to have no effect on the sorption process. Retained species were eluted using 5 mL of 2 M H/sub 2/SO/sub 4/. The kinetics of sorption were observed to follow the pseudo first order rate equation. The sorption data followed Freundlich and D-R isotherms. The energy value obtained from the D-R isotherms indicated that the sorption was physical in nature for arsenate species. Our study has shown that banana peel has the ability to remove arsenate species from ground water samples. (author)

Performance with lead ions of the LHC beam dump system

CERN Document Server

Bruce, R; Jensen, L; Lefèvre, T; Weterings, W

2007-01-01

The LHC beam dump system must function safely with 208Pb82+ions. The differences with respect to the LHC proton beams are briefly recalled, and the possible areas for performance concerns discussed, in particular the various beam intercepting devices and the beam instrumentation. Energy deposition simulation results for the most critical elements are presented, and the conclusions drawn for the lead ion operation. The expected performance of the beam instrumentation systems are reviewed in the context of the damage potential of the ion beam and the required functionality of the various safety and post-operational analysis requirements.

Analysis and modification of blue sapphires from Rwanda by ion beam techniques

Energy Technology Data Exchange (ETDEWEB)

Bootkul, D., E-mail: mo_duangkhae@hotmail.com [Department of General Science - Gems & Jewelry, Faculty of Science, Srinakharinwirot University, Bangkok 10110 (Thailand); Chaiwai, C.; Tippawan, U. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Wanthanachaisaeng, B. [Gems Enhancement Research Unit, Faculty of Gems, Burapha University, Chanthaburi Campus, Chanthaburi 22170 (Thailand); Intarasiri, S., E-mail: saweat@gmail.com [Science and Technology Research Institute, Chiang Mai University, Chiang Mai 50200 (Thailand)

2015-12-15

Highlights: • Ion beam analysis is an effective method for detecting trace elements. • Ion beam treatment is able to improve optical and color appearances of the blue sapphire from Rwanda. • These alternative methods can be extended to jewelry industry for large scale application. - Abstract: Blue sapphire is categorised in a corundum (Al{sub 2}O{sub 3}) group. The gems of this group are always amazed by their beauties and thus having high value. In this study, blue sapphires from Rwanda, recently came to Thai gemstone industry, are chosen for investigations. On one hand, we have applied Particle Induced X-ray Emission (PIXE), which is a highly sensitive and precise analytical technique that can be used to identify and quantify trace elements, for chemical analysis of the sapphires. Here we have found that the major element of blue sapphires from Rwanda is Al with trace elements such as Fe, Ti, Cr, Ga and Mg as are commonly found in normal blue sapphire. On the other hand, we have applied low and medium ion implantations for color improvement of the sapphire. It seems that a high amount of energy transferring during cascade collisions have altered the gems properties. We have clearly seen that the blue color of the sapphires have been intensified after nitrogen ion bombardment. In addition, the gems were also having more transparent and luster. The UV–Vis–NIR measurement detected the modification of their absorption properties, implying of the blue color increasing. Here the mechanism of these modifications is postulated and reported. In any point of view, the bombardment by using nitrogen ion beam is a promising technique for quality improvement of the blue sapphire from Rwanda.

Depth profile analysis of thin TiOxNy films using standard ion beam analysis techniques and HERDA

International Nuclear Information System (INIS)

Markwitz, A.; Dytlewski, N.; Cohen, D.

1999-01-01

Ion beam assisted deposition is used to fabricate thin titanium oxynitride films (TiO x N y ) at Industrial Research (typical film thickness 100nm). At the Institute of Geological and Nuclear Sciences, the thin films are analysed using non-destructive standard ion beam analysis (IBA) techniques. High-resolution titanium depth profiles are measured with RBS using 1.5MeV 4 He + ions. Non-resonant nuclear reaction analysis (NRA) is performed for investigating the amounts of O and N in the deposited films using the reactions 16 O(d,p) 17 O at 920 keV and 14 N(d,α) 12 C at 1.4 MeV. Using a combination of these nuclear techniques, the stoichiometry as well as the thickness of the layers is revealed. However, when oxygen and nitrogen depth profiles are required for investigating stoichiometric changes in the films, additional nuclear analysis techniques such as heavy ion elastic recoil detection (HERDA) have to be applied. With HERDA, depth profiles of N, O, and Ti are measured simultaneously. In this paper comparative IBA measurement s of TiO x N y films with different compositions are presented and discussed

Mixed beams for the nuclear microprobe

Energy Technology Data Exchange (ETDEWEB)

Saint, A.; Breese, M.B.H.; Legge, G.L.F. [Melbourne Univ., Parkville, VIC (Australia). School of Physics

1996-12-31

Recently the Micro-Analytical Research Centre (MARC) at Melbourne University has developed a technique to provide mixed beams of ions for a magnetically focussed nuclear microprobe. Such a mixed beam is defined as two (or more) beams of different species ions that can quickly and easily be made to have the same magnetic rigidity R{sub m} = (mE/q{sup 2}) and therefore be transported, focused and scanned the same in a magnetic nuclear microprobe. The production of mixed beams in an electrostatically focussed micro- probe have already been demonstrated. This paper will show how mixed beams can be produced on a single-ended accelerator. Indications of how to produce them on a tandem will also be given. Applications of these mixed beams in micro-lithography, scanning transmission ion microscopy (STIM) imaging and ion beam induced charge (IBIC) imaging will also be presented. 3 refs., 3 figs.

Mixed beams for the nuclear microprobe

Energy Technology Data Exchange (ETDEWEB)

Saint, A; Breese, M B.H.; Legge, G L.F. [Melbourne Univ., Parkville, VIC (Australia). School of Physics

1997-12-31

Recently the Micro-Analytical Research Centre (MARC) at Melbourne University has developed a technique to provide mixed beams of ions for a magnetically focussed nuclear microprobe. Such a mixed beam is defined as two (or more) beams of different species ions that can quickly and easily be made to have the same magnetic rigidity R{sub m} = (mE/q{sup 2}) and therefore be transported, focused and scanned the same in a magnetic nuclear microprobe. The production of mixed beams in an electrostatically focussed micro- probe have already been demonstrated. This paper will show how mixed beams can be produced on a single-ended accelerator. Indications of how to produce them on a tandem will also be given. Applications of these mixed beams in micro-lithography, scanning transmission ion microscopy (STIM) imaging and ion beam induced charge (IBIC) imaging will also be presented. 3 refs., 3 figs.

Trace element mapping in Parkinsonian brain by quantitative ion beam microscopy

Science.gov (United States)

Barapatre, Nirav; Morawski, Markus; Butz, Tilman; Reinert, Tilo

2010-06-01

The role of iron in the pathogenesis of the Parkinson's disease (PD) is a current subject of research in Neurochemistry, since an abnormal increase in iron is reported in the substantia nigra (SN) of Parkinsonian patients. A severe loss of the cells containing dopamine in the SN in the PD has also drawn attention towards the function of a browny-black pigment called neuromelanin, which accumulates predominantly in these dopaminergic neurons. The neuromelanin has an ability to chelate metal ions, which, in free state, may cause considerable damage to cells by reacting with their lipid-rich membranes. However, it could also potentiate free radical production if it releases the bound metal ions. The highly sensitive and non-destructive micro-PIXE method suits best to quantify and map the trace elements in the SN. The accuracy in charge measurement for such microanalysis studies is of utmost importance for quantitative analysis. Since a Faraday cup is usually placed behind the thin biological sample to measure the charge, the primary and the secondary electrons, knocked out from the sample by traversing ion beam, hamper an exact charge determination. Hence, a new non-interceptive technique was developed for precise charge measurement and for continuous monitoring of beam current.

Trace element mapping in Parkinsonian brain by quantitative ion beam microscopy

International Nuclear Information System (INIS)

Barapatre, Nirav; Morawski, Markus; Butz, Tilman; Reinert, Tilo

2010-01-01

The role of iron in the pathogenesis of the Parkinson's disease (PD) is a current subject of research in Neurochemistry, since an abnormal increase in iron is reported in the substantia nigra (SN) of Parkinsonian patients. A severe loss of the cells containing dopamine in the SN in the PD has also drawn attention towards the function of a browny-black pigment called neuromelanin, which accumulates predominantly in these dopaminergic neurons. The neuromelanin has an ability to chelate metal ions, which, in free state, may cause considerable damage to cells by reacting with their lipid-rich membranes. However, it could also potentiate free radical production if it releases the bound metal ions. The highly sensitive and non-destructive micro-PIXE method suits best to quantify and map the trace elements in the SN. The accuracy in charge measurement for such microanalysis studies is of utmost importance for quantitative analysis. Since a Faraday cup is usually placed behind the thin biological sample to measure the charge, the primary and the secondary electrons, knocked out from the sample by traversing ion beam, hamper an exact charge determination. Hence, a new non-interceptive technique was developed for precise charge measurement and for continuous monitoring of beam current.

Trace element mapping in Parkinsonian brain by quantitative ion beam microscopy

Energy Technology Data Exchange (ETDEWEB)

Barapatre, Nirav, E-mail: barapatre@physik.uni-leipzig.d [Nukleare Festkoerperphysik, Universitaet Leipzig, Linnestr. 5, 04103 Leipzig (Germany); Morawski, Markus [Paul-Flechsig-Institut fuer Hirnforschung, Universitaet Leipzig, Jahnalle 59, 04109 Leipzig (Germany); Butz, Tilman; Reinert, Tilo [Nukleare Festkoerperphysik, Universitaet Leipzig, Linnestr. 5, 04103 Leipzig (Germany)

2010-06-15

The role of iron in the pathogenesis of the Parkinson's disease (PD) is a current subject of research in Neurochemistry, since an abnormal increase in iron is reported in the substantia nigra (SN) of Parkinsonian patients. A severe loss of the cells containing dopamine in the SN in the PD has also drawn attention towards the function of a browny-black pigment called neuromelanin, which accumulates predominantly in these dopaminergic neurons. The neuromelanin has an ability to chelate metal ions, which, in free state, may cause considerable damage to cells by reacting with their lipid-rich membranes. However, it could also potentiate free radical production if it releases the bound metal ions. The highly sensitive and non-destructive micro-PIXE method suits best to quantify and map the trace elements in the SN. The accuracy in charge measurement for such microanalysis studies is of utmost importance for quantitative analysis. Since a Faraday cup is usually placed behind the thin biological sample to measure the charge, the primary and the secondary electrons, knocked out from the sample by traversing ion beam, hamper an exact charge determination. Hence, a new non-interceptive technique was developed for precise charge measurement and for continuous monitoring of beam current.

Intense ion beam generator

International Nuclear Information System (INIS)

Humphries, S. Jr.; Sudan, R.N.

1977-01-01

Methods and apparatus for producing intense megavolt ion beams are disclosed. In one embodiment, a reflex triode-type pulsed ion accelerator is described which produces ion pulses of more than 5 kiloamperes current with a peak energy of 3 MeV. In other embodiments, the device is constructed so as to focus the beam of ions for high concentration and ease of extraction, and magnetic insulation is provided to increase the efficiency of operation

Ion beam assisted film growth

CERN Document Server

Itoh, T

2012-01-01

This volume provides up to date information on the experimental, theoretical and technological aspects of film growth assisted by ion beams.Ion beam assisted film growth is one of the most effective techniques in aiding the growth of high-quality thin solid films in a controlled way. Moreover, ion beams play a dominant role in the reduction of the growth temperature of thin films of high melting point materials. In this way, ion beams make a considerable and complex contribution to film growth. The volume will be essential reading for scientists, engineers and students working in thi

Beam analysis spectrometer for relativistic heavy ions

International Nuclear Information System (INIS)

Schimmerling, W.; Subramanian, T.S.; McDonald, W.J.; Kaplan, S.N.; Sadoff, A.; Gabor, G.

1983-01-01

A versatile spectrometer useful for measuring the mass, charge, energy, fluence and angular distribution of primaries and fragments associated with relativistic heavy ion beams is described. The apparatus is designed to provide accurate physical data for biology experiments and medical therapy planning as a function of depth in tissue. The spectrometer can also be used to measure W, the average energy to produce an ion pair, range-energy, dE/dx, and removal cross section data of interest in nuclear physics. (orig.)

Industrial applications of high energy micro-beams

International Nuclear Information System (INIS)

Bakhru, H.; Nickles, E.; Haberl, A.W.

1995-01-01

The University at Albany ion scanning microprobe has been used for industrial applications. Several examples of such applications will be presented. Focused proton and helium ion beams of 1-2 μm dimensions have been used for the analysis. Rutherford backscattering spectrometry (RBS) and particle induced X-ray emission (PIXE) analysis have been performed on very large scale integrated circuits, thin film superconductors, small structures of high voltage cables and for several other industrial applications. Several examples of chemical and microstructural analysis will be presented. (orig.)

Fabrication of optical channel waveguides in crystals and glasses using macro- and micro ion beams

Energy Technology Data Exchange (ETDEWEB)

Bányász, I., E-mail: banyasz@sunserv.kfki.hu [Wigner Research Centre for Physics, Hungarian Academy of Sciences, P.O. Box 49, H-1525 Budapest (Hungary); Rajta, I.; Nagy, G.U.L. [MTA Atomki, Institute for Nuclear Research, Hungarian Academy of Sciences, P.O. Box 51, H-4001 Debrecen (Hungary); Zolnai, Z. [Research Institute for Technical Physics and Materials Science, Research Centre for Natural Sciences, Hungarian Academy of Sciences, P.O. Box 49, H-1525 Budapest (Hungary); Havranek, V. [Nuclear Physics Institute AV CR, Řež near Prague 250 68 (Czech Republic); Pelli, S. [MDF-Lab, “Nello Carrara” Institute of Applied Physics, IFAC-CNR, Via Madonna del Piano 10, 50019 Sesto Fiorentino, FI (Italy); “Enrico Fermi” Center for Study and Research, Piazza del Viminale 2, 00184 Roma (Italy); Veres, M. [Wigner Research Centre for Physics, Hungarian Academy of Sciences, P.O. Box 49, H-1525 Budapest (Hungary); Berneschi, S.; Nunzi-Conti, G. [MDF-Lab, “Nello Carrara” Institute of Applied Physics, IFAC-CNR, Via Madonna del Piano 10, 50019 Sesto Fiorentino, FI (Italy); Righini, G.C. [“Enrico Fermi” Center for Study and Research, Piazza del Viminale 2, 00184 Roma (Italy)

2014-07-15

Active and passive optical waveguides are fundamental elements in modern telecommunications systems. A great number of optical crystals and glasses were identified and are used as good optoelectronic materials. However, fabrication of waveguides in some of those materials remains still a challenging task due to their susceptibility to mechanical or chemical damages during processing. Researches were initiated on ion beam fabrication of optical waveguides in tellurite glasses. Channel waveguides were written in Er:TeO{sub 2}–WO{sub 3} glass through a special silicon mask using 1.5 MeV N{sup +} irradiation. This method was improved by increasing N{sup +} energy to 3.5 MeV to achieve confinement at the 1550 nm wavelength, too. An alternative method, direct writing of the channel waveguides in the tellurite glass using focussed beams of 6–11 MeV C{sup 3+} and C{sup 5+} and 5 MeV N{sup 3+}, has also been developed. Channel waveguides were fabricated in undoped eulytine-(Bi{sub 4}Ge{sub 3}O{sub 12}) and sillenite type (Bi{sub 12}GeO{sub 20}) bismuth germanate crystals using both a special silicon mask and a thick SU8 photoresist mask and 3.5 MeV N{sup +} irradiation. The waveguides were studied by phase contrast and interference microscopy and micro Raman spectroscopy. Guiding properties were checked by the end fire method.

Fast Monte Carlo for ion beam analysis simulations

International Nuclear Information System (INIS)

Schiettekatte, Francois

2008-01-01

A Monte Carlo program for the simulation of ion beam analysis data is presented. It combines mainly four features: (i) ion slowdown is computed separately from the main scattering/recoil event, which is directed towards the detector. (ii) A virtual detector, that is, a detector larger than the actual one can be used, followed by trajectory correction. (iii) For each collision during ion slowdown, scattering angle components are extracted form tables. (iv) Tables of scattering angle components, stopping power and energy straggling are indexed using the binary representation of floating point numbers, which allows logarithmic distribution of these tables without the computation of logarithms to access them. Tables are sufficiently fine-grained that interpolation is not necessary. Ion slowdown computation thus avoids trigonometric, inverse and transcendental function calls and, as much as possible, divisions. All these improvements make possible the computation of 10 7 collisions/s on current PCs. Results for transmitted ions of several masses in various substrates are well comparable to those obtained using SRIM-2006 in terms of both angular and energy distributions, as long as a sufficiently large number of collisions is considered for each ion. Examples of simulated spectrum show good agreement with experimental data, although a large detector rather than the virtual detector has to be used to properly simulate background signals that are due to plural collisions. The program, written in standard C, is open-source and distributed under the terms of the GNU General Public License

Energy analysis of the ion beam from plasma focus

International Nuclear Information System (INIS)

Kilic, H.; Nardi, V.; Prior, W.

1984-01-01

The authors have experimentally determined the energy spectrum of a deuteron beam in the energy interval 100 KeV ≤ E ≤ 10 MeV, with typical beam current I ≥ 1-2 A. A 5 kJ (15 kV, 49 μF) plasma focus machine is used to generate the ion beam at relatively low pressure 3-4 Torr D/sub 2/ (beam anode) and at higher pressure 6-8 Torr D/sub 2/ (high-neutron-yield mode). The spectrum is obtained from two different methods, i.e. from ion time of flight - by using time delays of Faraday cup signals with respect to hard x-ray signals - and from ion filtering, (mylar filter with different thickness from 2.5 μm up to 500 μm are used to cover the Faraday cup). The Faraday cup is located in a differentially pumed chamber (10/sup -4/ - 10/sup -5/ Torr) which is separated from the plasma focus chamber (8-3 Torr) by a 150 μm diam. pinhole (12.5 μm thick tungsten foil). The pinhole and Faraday cup are positioned on the gun axis at a distance of 15 cm and 25 cm from the end of the anode respectively

Mini biased collimated faraday cups for measurement of intense pulsed ion beams

International Nuclear Information System (INIS)

He Xiaoping; Shi Lei; Zhang Jiasheng; Qiu Aici

2000-01-01

An analysis of principle of a biased Faraday cup for measuring ion beams density and the main reasons related to the measuring accuracy were presented. An array of mini biased collimated Faraday cups was manufactured for the measurement of ion beam density of a compact 200 keV high power ion beam source. In the experiments the maximum density of ion beam was in the center of the beam, and it was about 170 A/cm 2

Beam-plasma discharge in a Kyoto beam-plasma-ion source

International Nuclear Information System (INIS)

Ishikawa, J.; Takagi, T.

1983-01-01

A beam-plasma type ion source employing an original operating principle has been developed by the present authors. The ion source consists of an ion extraction region with an electron gun, a thin long drift tube as the plasma production chamber, and a primary electron beam collector. An electron beam is effectively utilized for the dual purpose of high density plasma production as a result of beam-plasma discharge, and high current ion beam extraction with ion space-charge compensation. A high density plasma of the order of 10 11 --10 13 cm -3 was produced by virtue of the beam-plasma discharge which was caused by the interaction between a space-charge wave on the electron beam and a high frequency plasma wave. The plasma density then produced was 10 2 --10 3 times the density produced only by collisional ionization by the electron beam. In order to obtain a stable beam-plasma discharge, a secondary electron beam emitted from the electron collector should be utilized. The mechanism of the beam-plasma discharge was analyzed by use of a linear theory in the case of the small thermal energy of the electron beam, and by use of a quasilinear theory in the case of the large thermal energy. High current ion beams of more than 0.1 A were extracted even at a low extraction voltage of 1--5 kV

Surface studies with high-energy ion beams

Energy Technology Data Exchange (ETDEWEB)

Stensgaard, Ivan [Aarhus Univ. (Denmark). Inst. of Physics

1992-07-01

High-energy ion scattering is an extremely useful technique for surface studies. Three methods for surface composition analysis (Rutherford backscattering, nuclear-reaction analysis and elastic recoil detection) are discussed. Directional effects in ion-beam surface interactions (shadowing and blocking) form the basis for surface structure analysis with high-energy ion beams and these phenomena are addressed in some detail. It is shown how surface relaxation and reconstruction, as well as positions of adsorbed atoms, can be determined by comparison with computer simulations. A special technique called transmission channelling is introduced and shown to be particularly well suited for studies of adsorption positions, even of hydrogen. Recent developments in the field are demonstrated by discussing a large number of important (experimental) applications which also include surface dynamics and melting, as well as epitaxy and interface structure. (author).

Low-energy ion-beam deposition apparatus equipped with surface analysis system

International Nuclear Information System (INIS)

Ohno, Hideki; Aoki, Yasushi; Nagai, Siro.

1994-10-01

A sophisticated apparatus for low energy ion beam deposition (IBD) was installed at Takasaki Radiation Chemistry Research Establishment of JAERI in March 1991. The apparatus is composed of an IBD system and a real time/in-situ surface analysis system for diagnosing deposited thin films. The IBD system provides various kinds of low energy ion down to 10 eV with current density of 10 μA/cm 2 and irradiation area of 15x15 mm 2 . The surface analysis system consists of RHEED, AES, ISS and SIMS. This report describes the characteristics and the operation procedure of the apparatus together with some experimental results on depositing thin carbon films. (author)

Brightness measurement of an electron impact gas ion source for proton beam writing applications

Energy Technology Data Exchange (ETDEWEB)

Liu, N.; Santhana Raman, P. [Centre for Ion Beam Applications, Department of Physics, National University of Singapore, Singapore 117542 (Singapore); Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583 (Singapore); Xu, X.; Pang, R.; Kan, J. A. van, E-mail: phyjavk@nus.edu.sg [Centre for Ion Beam Applications, Department of Physics, National University of Singapore, Singapore 117542 (Singapore); Khursheed, A. [Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583 (Singapore)

2016-02-15

We are developing a high brightness nano-aperture electron impact gas ion source, which can create ion beams from a miniature ionization chamber with relatively small virtual source sizes, typically around 100 nm. A prototype source of this kind was designed and successively micro-fabricated using integrated circuit technology. Experiments to measure source brightness were performed inside a field emission scanning electron microscope. The total output current was measured to be between 200 and 300 pA. The highest estimated reduced brightness was found to be comparable to the injecting focused electron beam reduced brightness. This translates into an ion reduced brightness that is significantly better than that of conventional radio frequency ion sources, currently used in single-ended MeV accelerators.

Control of colliding ion beams

International Nuclear Information System (INIS)

Salisbury, W.W.

1985-01-01

This invention relates to a method and system for enhancing the power-producing capability of a nuclear fusion reactor, and more specifically to methods and structure for enhancing the ion density in a directed particle fusion reactor. In accordance with the invention, oppositely directed ion beams constrained to helical paths pass through an annular reaction zone. The object is to produce fusion reactions due to collisions between the ion beams. The reaction zone is an annulus as between an inner-cylindrical electrode and an outer-cylindrical coaxial electrode. The beams are enhanced in ion density at spaced points along the paths by providing spline structures protruding from the walls of the electrodes into the reaction zone. This structure causes variations in the electric field along the paths followed by the ion beams. Such fields cause the beams to be successively more and less concentrated as the beams traverse the reaction zone. Points of high concentration are the points at which fusion-producing collisions are most likely to take place

Ion beam enhancement in magnetically insulated ion diodes for high-intensity pulsed ion beam generation in non-relativistic mode

Energy Technology Data Exchange (ETDEWEB)

Zhu, X. P. [Key Laboratory of Materials Modification by Laser, Ion, and Electron Beams, Ministry of Education, Dalian University of Technology, Dalian 116024 (China); Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024 (China); Zhang, Z. C.; Lei, M. K., E-mail: surfeng@dlut.edu.cn [Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024 (China); Pushkarev, A. I. [Surface Engineering Laboratory, School of Materials Science and Engineering, Dalian University of Technology, Dalian 116024 (China); Laboratory of Beam and Plasma Technology, High Technologies Physics Institute, Tomsk Polytechnic University, 30, Lenin Ave, 634050 Tomsk (Russian Federation)

2016-01-15

High-intensity pulsed ion beam (HIPIB) with ion current density above Child-Langmuir limit is achieved by extracting ion beam from anode plasma of ion diodes with suppressing electron flow under magnetic field insulation. It was theoretically estimated that with increasing the magnetic field, a maximal value of ion current density may reach nearly 3 times that of Child-Langmuir limit in a non-relativistic mode and close to 6 times in a highly relativistic mode. In this study, the behavior of ion beam enhancement by magnetic insulation is systematically investigated in three types of magnetically insulated ion diodes (MIDs) with passive anode, taking into account the anode plasma generation process on the anode surface. A maximal enhancement factor higher than 6 over the Child-Langmuir limit can be obtained in the non-relativistic mode with accelerating voltage of 200–300 kV. The MIDs differ in two anode plasma formation mechanisms, i.e., surface flashover of a dielectric coating on the anode and explosive emission of electrons from the anode, as well as in two insulation modes of external-magnetic field and self-magnetic field with either non-closed or closed drift of electrons in the anode-cathode (A-K) gap, respectively. Combined with ion current density measurement, energy density characterization is employed to resolve the spatial distribution of energy density before focusing for exploring the ion beam generation process. Consistent results are obtained on three types of MIDs concerning control of neutralizing electron flows for the space charge of ions where the high ion beam enhancement is determined by effective electron neutralization in the A-K gap, while the HIPIB composition of different ion species downstream from the diode may be considerably affected by the ion beam neutralization during propagation.

Electron beam based transversal profile measurements of intense ion beams

International Nuclear Information System (INIS)

El Moussati, Said

2014-01-01

A non-invasive diagnostic method for the experimental determination of the transverse profile of an intense ion beam has been developed and investigated theoretically as well as experimentally within the framework of the present work. The method is based on the deflection of electrons when passing the electromagnetic field of an ion beam. To achieve this an electron beam is employed with a specifically prepared transversal profile. This distinguish this method from similar ones which use thin electron beams for scanning the electromagnetic field [Roy et al. 2005; Blockland10]. The diagnostic method presented in this work will be subsequently called ''Electron-Beam-Imaging'' (EBI). First of all the influence of the electromagnetic field of the ion beam on the electrons has been theoretically analyzed. It was found that the magnetic field causes only a shift of the electrons along the ion beam axis, while the electric field only causes a shift in a plane transverse to the ion beam. Moreover, in the non-relativistic case the magnetic force is significantly smaller than the Coulomb one and the electrons suffer due to the magnetic field just a shift and continue to move parallel to their initial trajectory. Under the influence of the electric field, the electrons move away from the ion beam axis, their resulting trajectory shows a specific angle compared to the original direction. This deflection angle practically depends just on the electric field of the ion beam. Thus the magnetic field has been neglected when analysing the experimental data. The theoretical model provides a relationship between the deflection angle of the electrons and the charge distribution in the cross section of the ion beam. The model however only can be applied for small deflection angles. This implies a relationship between the line-charge density of the ion beam and the initial kinetic energy of the electrons. Numerical investigations have been carried out to clarify the

Realization of a diamond based high density multi electrode array by means of Deep Ion Beam Lithography

International Nuclear Information System (INIS)

Picollo, F.; Battiato, A.; Bernardi, E.; Boarino, L.; Enrico, E.; Forneris, J.; Gatto Monticone, D.; Olivero, P.

2015-01-01

In the present work we report about a parallel-processing ion beam fabrication technique whereby high-density sub-superficial graphitic microstructures can be created in diamond. Ion beam implantation is an effective tool for the structural modification of diamond: in particular ion-damaged diamond can be converted into graphite, therefore obtaining an electrically conductive phase embedded in an optically transparent and highly insulating matrix. The proposed fabrication process consists in the combination of Deep Ion Beam Lithography (DIBL) and Focused Ion Beam (FIB) milling. FIB micromachining is employed to define micro-apertures in the contact masks consisting of thin (<10 μm) deposited metal layers through which ions are implanted in the sample. A prototypical single-cell biosensor was realized with the above described technique. The biosensor has 16 independent electrodes converging inside a circular area of 20 μm diameter (typical neuroendocrine cells size) for the simultaneous recording of amperometric signals

Application of ion beams for polymeric carbon based biomaterials

International Nuclear Information System (INIS)

Evelyn, A.L.

2001-01-01

Ion beams have been shown to be quite suitable for the modification and analysis of carbon based biomaterials. Glassy polymeric carbon (GPC), made from cured phenolic resins, has a high chemical inertness that makes it useful as a biomaterial in medicine for drug delivery systems and for the manufacture of heart valves and other prosthetic devices. Low and high-energy ion beams have been used, with both partially and fully cured phenolic resins, to enhance biological cell/tissue growth on, and to increase tissue adhesion to GPC surfaces. Samples bombarded with energetic ion beams in the keV to MeV range exhibited increased surface roughness, measured using optical microscopy and atomic force microscopy. Ion beams were also used to perform nuclear reaction analyses of GPC encapsulated drugs for use in internal drug delivery systems. The results from the high energy bombardment were more dramatic and are shown in this paper. The interaction of energetic ions has demonstrated the useful application of ion beams to enhance the properties of carbon-based biomaterials

The Aarhus Ion Micro-Trap Project

DEFF Research Database (Denmark)

Miroshnychenko, Yevhen; Nielsen, Otto; Poulsen, Gregers

As part of our involvement in the EU MICROTRAP project, we have designed, manufactured and assembled a micro-scale ion trap with integrated optical fibers. These prealigned fibers will allow delivering cooling laser light to single ions. Therefore, such a trap will not require any direct optical...... and installed in an ultra high vacuum chamber, which includes an ablation oven for all-optical loading of the trap [2]. The next steps on the project are to demonstrate the operation of the micro-trap and the cooling of ions using fiber delivered light. [1] D. Grant, Development of Micro-Scale Ion traps, Master...... Thesis (2008). [2] R.J. Hendricks, D.M. Grant, P.F. Herskind, A. Dantan and M. Drewsen, An all-optical ion-loading technique for scalable microtrap architectures, Applied Physics B, 88, 507 (2007)....

Characteristics of ancient Egyptian glazed ceramic objects from Fatimid and Mamluk periods as revealed by ion beam analysis

International Nuclear Information System (INIS)

Sadek, Hamada; Abd El Hady M M

2012-01-01

Ion beam analysis (PIXE, μPIXE) has been successfully applied in analysis of archaeological materials, it has many advantages. In this work Ion Beam Analysis (IBA) used in analysis of ancient Egyptian glazed ceramic from 10th to the 16th centuries (Fatimid and Mamluk periods). Glazed ceramic samples from Al-Fustat Excavation store have been chosen to represent different colours (green, blue, brown, black ...etc), the colours of glaze depend on many factors such as oxides present in the glaze layer, fluxes and the conditions in which objects had been manufactured in the past. Ion Beam allows the identification of elemental composition of the glaze layer i.e., the information about colorants used in glaze, which is of great importance for compositional data play a key role in solving questions concerning dating, provenance, technology, use and the relationship between ancient cultures with the environment.

In situ analysis of thin film deposition processes using time-of-flight (TOF) ion beam analysis methods

International Nuclear Information System (INIS)

Im, J.; Lin, Y.; Schultz, J.A.; Auciello, O.H.; Chang, R.P.H.

1995-05-01

Non-destructive, in situ methods for characterization of thin film growth phenomena is key to understand thin film growth processes and to develop more reliable deposition procedures, especially for complex layered structures involving multi-phase materials. However, surface characterization methods that use either electrons (e.g. AES or XPS) or low energy ions (SIMS) require an UHV environment and utilize instrumentation which obstructs line of sight access to the substrate and are therefore incompatible with line of sight deposition methods and thin film deposition processes which introduce gas, either part of the deposition or in order to produce the desired phase. We have developed a means of differentially pumping both the ion beam source and detectors of a TOF ion beam surface analysis spectrometer that does not interfere with the deposition process and permits compositional and structural analysis of the growing film in the present system, at pressures up to several mTorr. Higher pressures are feasible with modified source-detector geometry. In order to quantify the sensitivity of Ion Scattering Spectroscopy (ISS) and Direct Recoil Spectroscopy (DRS), we have measured the signal intensity for stabilized clean metals in a variety of gas environments as a function of the ambient gas species and pressure, and ion beam species and kinetic energy. Results are interpreted in terms of collision cross sections which are compared with known gas phase scattering data and provide an apriori basis for the evaluation of time-of-flight ion scattering and recoil spectroscopies (ToF-ISARS) for various industrial processing environments which involve both inert and reactive cases. The cross section data for primary ion-gas molecule and recoiled atom-gas molecule interactions are also provided. from which the maximum operating pressure in any experimental configuration can be obtained

Development of a single ion micro-irradiation facility for experimental radiobiology at cell level; Developpement d'une ligne d'irradiation microfaisceau en mode ion par ion pour la radiobiologie experimentale a l'echelle cellulaire

Energy Technology Data Exchange (ETDEWEB)

Barberet, Ph

2003-10-01

A micro-irradiation device has been developed for radiobiology applications at the scale of the cell. This device is based on an upgrade of an existing micro-beam line that was already able to deliver a 1 to 3 MeV proton or alpha beam of low intensity and whose space resolution is lower than 1 micrometer in vacuum. The important part of this work has been the development of an irradiation stage designed to fit on the micro-probe and able to deliver ions in the air with an absolute accuracy of a few micrometers. A program has been set up to monitor the complete irradiation line in testing and in automatic irradiation operating phases. Simulation tools based on Monte-Carlo calculations have been validated through comparisons with experimental data particularly in the field of spatial resolution and of the number of ions delivered. The promising results show the possibility in a near future to use this tool to study the response of cells to very low irradiation doses down to the extreme limit of one ion per cell.

Focused ion beam (FIB) milling of electrically insulating specimens using simultaneous primary electron and ion beam irradiation

International Nuclear Information System (INIS)

Stokes, D J; Vystavel, T; Morrissey, F

2007-01-01

There is currently great interest in combining focused ion beam (FIB) and scanning electron microscopy technologies for advanced studies of polymeric materials and biological microstructures, as well as for sophisticated nanoscale fabrication and prototyping. Irradiation of electrically insulating materials with a positive ion beam in high vacuum can lead to the accumulation of charge, causing deflection of the ion beam. The resultant image drift has significant consequences upon the accuracy and quality of FIB milling, imaging and chemical vapour deposition. A method is described for suppressing ion beam drift using a defocused, low-energy primary electron beam, leading to the derivation of a mathematical expression to correlate the ion and electron beam energies and currents with other parameters required for electrically stabilizing these challenging materials

Full three-dimensional simulation of focused ion beam micro/nanofabrication

International Nuclear Information System (INIS)

Kim, Heung-Bae; Hobler, Gerhard; Steiger, Andreas; Lugstein, Alois; Bertagnolli, Emmerich

2007-01-01

2D focused ion beam simulation is only capable of simulating the topography where the surface shape does not change along the third dimension, both in the final result and during processing. In this paper we show that a 3D topography forms under the beam even though the variation in the final result along the third direction is small. We present the code AMADEUS 3D (advanced modelling and design environment for sputter processes), which is capable of simulating the surface topography in 3D space including angle-dependent sputtering and redeposition. The surface is represented by a structured or unstructured grid, and the nodes are moved according to the calculated sputtering and redeposition fluxes. In addition, experiments have been performed on nanodot formation and box milling for a case where a 3D temporary topography forms. The excellent agreement validates the code and shows the completeness of the model

Ion beams: from plasma physics to applications in analysis and irradiation fields

International Nuclear Information System (INIS)

Khodja, Hicham

2012-01-01

In this HDR (Accreditation to supervise research) report, the author proposes an overview of his research activities. A first part comments a research which aimed at determining the distribution of ion populations in an electron cyclotron resonance (ECR) plasma. Then, after a brief recall of the principles and techniques of analysis based on ion beams, he presents some characteristics of the CEA/Saclay nuclear microprobe. He reports various works related to material science and to biology, and discusses the associated perspectives [fr

Study of ion tracks by micro-probe ion energy loss spectroscopy

Czech Academy of Sciences Publication Activity Database

Vacík, Jiří; Havránek, Vladimír; Hnatowicz, Vladimír; Horák, Pavel; Fink, Dietmar; Apel, P. Yu.

2014-01-01

Roč. 332, AUG (2014), s. 308-311 ISSN 0168-583X. [21st International Conference on Ion Beam Analysis (IBA). Seattle, 23.06.2013-28.06.2013] R&D Projects: GA ČR(CZ) GBP108/12/G108; GA MŠk(XE) LM2011019 Institutional support: RVO:61389005 Keywords : ion energy loss spectrometry * single ion track * microprobe * tomography Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.124, year: 2014

Three-dimensional micro structured nanocomposite beams by microfluidic infiltration

International Nuclear Information System (INIS)

Lebel, L L; Paez, O A; Therriault, D; Aïssa, B; El Khakani, M A

2009-01-01

Three-dimensional (3D) micro structured beams reinforced with a single-walled carbon nanotube (C-SWNT)/polymer nanocomposite were fabricated using an approach based on the infiltration of 3D microfluidic networks. The 3D microfluidic network was first fabricated by the direct-write assembly method, which consists of the robotized deposition of fugitive ink filaments on an epoxy substrate, forming thereby a 3D micro structured scaffold. After encapsulating the 3D micro-scaffold structure with an epoxy resin, the fugitive ink was liquefied and removed, resulting in a 3D network of interconnected microchannels. This microfluidic network was then infiltrated by a polymer loaded with C-SWNTs and subsequently cured. Prior to their incorporation in the polymer matrix, the UV-laser synthesized C-SWNTs were purified, functionalized and dispersed into the matrix using a three-roll mixing mill. The final samples consist of rectangular beams having a complex 3D skeleton structure of C-SWNT/polymer nanocomposite fibers, adapted to offer better performance under flexural solicitation. Dynamic mechanical analysis in flexion showed an increase of 12.5% in the storage modulus compared to the resin infiltrated beams. The nanocomposite infiltration of microfluidic networks demonstrated here opens new prospects for the achievement of 3D reinforced micro structures

Heavy ion beams from the new Hungarian ECR ion source

International Nuclear Information System (INIS)

Biri, S.; Valek, A.; Ditroi, F.; Koivisto, H.; Arje, J.; Stiebing, K.; Schmidt, L.

1998-01-01

The first beams of highly charged ions in Hungary were obtained in fall of 1996. The new 14.5 GHz ECR ion source of ATOMKI produced beams of multiply charged ions with remarkable intensities at first experiments. Since then, numerous further developments were carried out. An external electrondonor electrode drastically increased the plasma density and, consequently, the intensity of highly charged ions. These upgrades concentrated mainly on beams from gaseous elements and were carried out by the ECRIS team of ATOMKI. Another series of experiments - ionising from solids - however, was done in the framework of an international collaboration. The first metal ion beam has been extracted from the ECRIS in November 1997 using the known method of Metal Ions from Volatile Compounds (MIVOC). The possibility to put the MIVOC chamber inside the ion source was also tested and the dosing regulation problem of metal vapours inside the ion source was solved. As a result, beams of more than 10 μA of highly charged Fe and Ni ions were produced. (author)

Nuclear micro-beam analysis of deuterium distribution in carbon fibre composites for controlled fusion devices

International Nuclear Information System (INIS)

Petersson, P.; Kreter, A.; Possnert, G.; Rubel, M.

2010-01-01

Probes made of carbon fibre composite NB41 were exposed to deuterium plasmas in the TEXTOR tokamak and in a simulator of plasma-wall interactions, PISCES. The aim was to assess the deuterium retention and its lateral and depth distribution. The analysis was performed by means of D( 3 He, p) 4 He and 12 C( 3 He, p) 14 N nuclear reactions analysis using a standard (1 mm spot) and micro-beam (20 μm resolution). The measurements have revealed non uniform distribution of deuterium atoms in micro-regions: differences by a factor of 3 between the maximum and minimum deuterium concentrations. The differences were associated with the orientation and type of fibres for samples exposed in PICSES. For surface structure in the erosion zone of samples exposed to a tokamak plasma the micro-regions were more complex. Depth profiling has indicated migration of fuel into the bulk of materials.

3D micro-optical elements for generation of tightly focused vortex beams

Directory of Open Access Journals (Sweden)

Balčytis Armandas

2015-01-01

Full Text Available Orbital angular momentum carrying light beams are usedfor optical trapping and manipulation. This emerging trend provides new challenges involving device miniaturization for improved performance and enhanced functionality at the microscale. Here we discus a new fabrication method based on combining the additive 3D structuring capability laser photopolymerization and the substractive sub-wavelength resolution patterning of focused ion beam lithography to produce micro-optical elements capable of compound functionality. As a case in point of this approach binary spiral zone pattern based high numerical aperture micro-lenses capable of generating topological charge carrying tightly focused vortex beams in a single wavefront transformation step are presented. The devices were modelled using finite-difference time-domain simulations, and the theoretical predictions were verified by optically characterizing the propagation properties of light transmitted through the fabricated structures. The resulting devices had focal lengths close to the predicted values of f = 18 µm and f = 13 µm as well as topological charge ℓ dependent vortex focal spot sizes of ~ 1:3 µm and ~ 2:0 µm for ℓ = 1 and ℓ = 2 respectively.

Intense non-relativistic cesium ion beam

International Nuclear Information System (INIS)

Lampel, M.C.

1984-02-01

The Heavy Ion Fusion group at Lawrence Berkeley Laboratory has constructed the One Ampere Cesium Injector as a proof of principle source to supply an induction linac with a high charge density and high brightness ion beam. This is studied here. An electron beam probe was developed as the major diagnostic tool for characterizing ion beam space charge. Electron beam probe data inversion is accomplished with the EBEAM code and a parametrically adjusted model radial charge distribution. The longitudinal charge distribution was not derived, although it is possible to do so. The radial charge distribution that is derived reveals an unexpected halo of trapped electrons surrounding the ion beam. A charge fluid theory of the effect of finite electron temperature on the focusing of neutralized ion beams (Nucl. Fus. 21, 529 (1981)) is applied to the problem of the Cesium beam final focus at the end of the injector. It is shown that the theory's predictions and assumptions are consistent with the experimental data, and that it accounts for the observed ion beam radius of approx. 5 cm, and the electron halo, including the determination of an electron Debye length of approx. 10 cm

Coupling analysis of the target temperature and thermal stress due to pulsed ion beam

International Nuclear Information System (INIS)

Yan Jie; Liu Meng; Lin Jufang; An Li; Long Xinggui

2013-01-01

Background: Target temperature has an important effect on the target life for the sealed neutron generator without cooling system. Purpose: To carry out the thermal-mechanical coupling analysis of the film-substrate target bombarded by the pulsed ion beam. Methods: The indirect coupling Finite Element Method (FEM) with a 2-dimensional time-space Gaussian axisymmetric power density as heat source was used to simulate the target temperature and thermal stress fields. Results: The effects of the target temperature and thermal stress fields under difference pulse widths and beam sizes were analyzed in terms of the FEM results. Conclusions: Combining with the temperature requirement and the thermal stress inducing film thermal mechanical destruction effect of the sealed neutron generator film-substrate targets, an optimized pulsed ion beam work status was proposed. (authors)

A beam test of prototype time projection chamber using micro ...

Indian Academy of Sciences (India)

We conducted a series of beam tests of prototype TPCs for the international linear collider (ILC) experiment, equipped with an MWPC, a MicroMEGAS, or GEMs as a readout device. The prototype operated successfully in a test beam at KEK under an axial magnetic field of up to 1 T. The analysis of data is now in progress ...

Ion Beam Analysis methods applied to the examination of Be//Cu joints in hipped Be tiles for ITER first wall mock- ups

International Nuclear Information System (INIS)

Vito, E. de; Cayron, C.; Hicham Khodja; Lorenzetto, P.

2006-01-01

A proposed fabrication route for ITER first wall components implies a diffusion welding step of Be tiles onto a Cu-based substrate. However, Be has a tendency to form particularly brittle intermetallics with Cu and a lot of other elements. Insertion of interlayers may be a solution to increase bond quality. Applying traditional analyses to this study can be problematic because of Be toxicity and low atomic number Z. Ion Beam Analysis methods have thus been considered together with scanning electron microscopy (SEM) and electron back-scattering diffraction (EBSD) as complementary techniques. The following work aims at demonstrating how such techniques (used in micro-beam mode), and in particular NRA (Nuclear Reaction Analysis) and PIXE (Particle Induced X-ray Emission) techniques, coupled with SEM/EBSD data, can bring valuable information in this area. Quantification of data allow to obtain concentration values (provided the hypotheses on the initial junction composition are valuable), then phase diagrams give clues about the composition and structure of the junction. SEM retro-diffused electrons chemical contrast images and EBSD allow to characterize the presence of the awaited intermetallics, and finally confirm or refine the conclusions of Ion Beam Analysis data quantification. A series of reference first wall mock-ups have been analysed. Interlayer-free mock-ups reveal intermetallics which are mainly BeCu (apparently mixed with lower quantities of BeCu 2 compound). While Cr or Ti interlayers seem to behave as good Be diffusion barriers in the sense that they prevent the formation of BeCu, they strongly interact with Cu to form CuTi 2 or Cr 2 Ti intermetallics. In the case of Cr, Be seems to be incorporated into the Cr layer. PIXE analysis has however been unable to characterize Al-based interlayers (Z=13, close to the lower PIXE sensibility limit) and emphasizes one limitation of Ion Beam Analysis methods for lighter metals, justifying the use of other

Negative ion beam processes

International Nuclear Information System (INIS)

Hayward, T.D.; Lawrence, G.P.; Bentley, R.F.; Malanify, J.J.; Jackson, J.A.

1975-06-01

Los Alamos Scientific Laboratory fiscal year 1975 work on production of intense, very bright, negative hydrogen (H - ), ion beams and conversion of a high-energy (a few hundred MeV) negative beam into a neutral beam are described. The ion source work has used a cesium charge exchange source that has produced H - ion beams greater than or equal to 10 mA (about a factor of 10 greater than those available 1 yr ago) with a brightness of 1.4 x 10 9 A/m 2 -rad 2 (about 18 times brighter than before). The high-energy, neutral beam production investigations have included measurements of the 800-MeV H - -stripping cross section in hydrogen gas (sigma/sub -10/, tentatively 4 x 10 -19 cm 2 ), 3- to 6-MeV H - -stripping cross sections in a hydrogen plasma (sigma/sub -10/, tentatively 2 to 4 x 10 -16 cm 2 ), and the small-angle scattering that results from stripping an 800-MeV H - ion beam to a neutral (H 0 ) beam in hydrogen gas. These last measurements were interrupted by the Los Alamos Meson Physics Facility shutdown in December 1974, but should be completed early in fiscal year 1976 when the accelerator resumes operation. Small-angle scattering calculations have included hydrogen gas-stripping, plasma-stripping, and photodetachment. Calculations indicate that the root mean square angular spread of a 390-MeV negative triton (T - ) beam stripped in a plasma stripper may be as low as 0.7 μrad

Cornell electron beam ion source

International Nuclear Information System (INIS)

Kostroun, V.O.; Ghanbari, E.; Beebe, E.N.; Janson, S.W.

1981-01-01

An electron beam ion source (EBIS) for the production of low energy, multiply charged ion beams to be used in atomic physics experiments has been designed and constructed. An external high perveance electron gun is used to launch the electron beam into a conventional solenoid. Novel features of the design include a distributed sputter ion pump to create the ultrahigh vacuum environment in the ionization region of the source and microprocessor control of the axial trap voltage supplies

Improvements in technique for determining the surfactant penetration in hair fibres using scanning ion beam analyses

International Nuclear Information System (INIS)

Hollands, R.; Clough, A.S.; Meredith, P.

1999-01-01

The penetration abilities of surfactants need to be known by companies manufacturing hair-care products. In this work three complementary techniques were used simultaneously - PIXE, NRA and RBS - to measure the penetration of a surfactant, which had been deuterated, into permed hair fibres. Using a scanning micro-beam of 2 MeV 3 He ions 2-dimensional concentration maps were obtained which showed whether the surfactant penetrated the fibre or just stayed on the surface. This is the first report of the use of three simultaneous scattering techniques with a scanning micro-beam. (author)

Pseudo ribbon metal ion beam source

International Nuclear Information System (INIS)

Stepanov, Igor B.; Ryabchikov, Alexander I.; Sivin, Denis O.; Verigin, Dan A.

2014-01-01

The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface

Pseudo ribbon metal ion beam source.

Science.gov (United States)

Stepanov, Igor B; Ryabchikov, Alexander I; Sivin, Denis O; Verigin, Dan A

2014-02-01

The paper describes high broad metal ion source based on dc macroparticle filtered vacuum arc plasma generation with the dc ion-beam extraction. The possibility of formation of pseudo ribbon beam of metal ions with the parameters: ion beam length 0.6 m, ion current up to 0.2 A, accelerating voltage 40 kV, and ion energy up to 160 kV has been demonstrated. The pseudo ribbon ion beam is formed from dc vacuum arc plasma. The results of investigation of the vacuum arc evaporator ion-emission properties are presented. The influence of magnetic field strength near the cathode surface on the arc spot movement and ion-emission properties of vacuum-arc discharge for different cathode materials are determined. It was shown that vacuum-arc discharge stability can be reached when the magnetic field strength ranges from 40 to 70 G on the cathode surface.

Ion-beam Plasma Neutralization Interaction Images

Energy Technology Data Exchange (ETDEWEB)

Igor D. Kaganovich; Edward Startsev; S. Klasky; Ronald C. Davidson

2002-04-09

Neutralization of the ion beam charge and current is an important scientific issue for many practical applications. The process of ion beam charge and current neutralization is complex because the excitation of nonlinear plasma waves may occur. Computer simulation images of plasma neutralization of the ion beam pulse are presented.

Ion-beam Plasma Neutralization Interaction Images

International Nuclear Information System (INIS)

Igor D. Kaganovich; Edward Startsev; S. Klasky; Ronald C. Davidson

2002-04-01

Neutralization of the ion beam charge and current is an important scientific issue for many practical applications. The process of ion beam charge and current neutralization is complex because the excitation of nonlinear plasma waves may occur. Computer simulation images of plasma neutralization of the ion beam pulse are presented

Modeling of intense pulsed ion beam heated masked targets for extreme materials characterization

Science.gov (United States)

Barnard, John J.; Schenkel, Thomas

2017-11-01

Intense, pulsed ion beams locally heat materials and deliver dense electronic excitations that can induce material modifications and phase transitions. Material properties can potentially be stabilized by rapid quenching. Pulsed ion beams with pulse lengths of order ns have recently become available for materials processing. Here, we optimize mask geometries for local modification of materials by intense ion pulses. The goal is to rapidly excite targets volumetrically to the point where a phase transition or local lattice reconstruction is induced followed by rapid cooling that stabilizes desired material's properties fast enough before the target is altered or damaged by, e.g., hydrodynamic expansion. By using a mask, the longitudinal dimension can be large compared to the transverse dimension, allowing the possibility of rapid transverse cooling. We performed HYDRA simulations that calculate peak temperatures for a series of excitation conditions and cooling rates of silicon targets with micro-structured masks and compare these to a simple analytical model. The model gives scaling laws that can guide the design of targets over a wide range of pulsed ion beam parameters.

Cluster ion beam facilities

International Nuclear Information System (INIS)

Popok, V.N.; Prasalovich, S.V.; Odzhaev, V.B.; Campbell, E.E.B.

2001-01-01

A brief state-of-the-art review in the field of cluster-surface interactions is presented. Ionised cluster beams could become a powerful and versatile tool for the modification and processing of surfaces as an alternative to ion implantation and ion assisted deposition. The main effects of cluster-surface collisions and possible applications of cluster ion beams are discussed. The outlooks of the Cluster Implantation and Deposition Apparatus (CIDA) being developed in Guteborg University are shown

An electron cyclotron resonance ion source based low energy ion beam platform

International Nuclear Information System (INIS)

Sun, L. T.; Shang, Y.; Ma, B. H.; Zhang, X. Z.; Feng, Y. C.; Li, X. X.; Wang, H.; Guo, X. H.; Song, M. T.; Zhao, H. Y.; Zhang, Z. M.; Zhao, H. W.; Xie, D. Z.

2008-01-01

To satisfy the requirements of surface and atomic physics study in the field of low energy multiple charge state ion incident experiments, a low energy (10 eV/q-20 keV/q) ion beam platform is under design at IMP. A simple test bench has been set up to test the ion beam deceleration systems. Considering virtues such as structure simplicity, easy handling, compactness, cost saving, etc., an all-permanent magnet ECRIS LAPECR1 [Lanzhou all-permanent magnet electron cyclotron resonance (ECR) ion source No. 1] working at 14.5 GHz has been adopted to produce intense medium and low charge state ion beams. LAPECR1 source has already been ignited. Some intense low charge state ion beams have been produced on it, but the first test also reveals that many problems are existing on the ion beam transmission line. The ion beam transmission mismatches result in the depressed performance of LAPECR1, which will be discussed in this paper. To obtain ultralow energy ion beam, after being analyzed by a double-focusing analyzer magnet, the selected ion beam will be further decelerated by two afocal deceleration lens systems, which is still under design. This design has taken into consideration both ions slowing down and also ion beam focusing. In this paper, the conceptual design of deceleration system will be discussed

An electron cyclotron resonance ion source based low energy ion beam platform.

Science.gov (United States)

Sun, L T; Shang, Y; Ma, B H; Zhang, X Z; Feng, Y C; Li, X X; Wang, H; Guo, X H; Song, M T; Zhao, H Y; Zhang, Z M; Zhao, H W; Xie, D Z

2008-02-01

To satisfy the requirements of surface and atomic physics study in the field of low energy multiple charge state ion incident experiments, a low energy (10 eV/q-20 keV/q) ion beam platform is under design at IMP. A simple test bench has been set up to test the ion beam deceleration systems. Considering virtues such as structure simplicity, easy handling, compactness, cost saving, etc., an all-permanent magnet ECRIS LAPECR1 [Lanzhou all-permanent magnet electron cyclotron resonance (ECR) ion source No. 1] working at 14.5 GHz has been adopted to produce intense medium and low charge state ion beams. LAPECR1 source has already been ignited. Some intense low charge state ion beams have been produced on it, but the first test also reveals that many problems are existing on the ion beam transmission line. The ion beam transmission mismatches result in the depressed performance of LAPECR1, which will be discussed in this paper. To obtain ultralow energy ion beam, after being analyzed by a double-focusing analyzer magnet, the selected ion beam will be further decelerated by two afocal deceleration lens systems, which is still under design. This design has taken into consideration both ions slowing down and also ion beam focusing. In this paper, the conceptual design of deceleration system will be discussed.

Accelerated ion beam research at ATOMKI

International Nuclear Information System (INIS)

Kiss, A.Z.

2009-01-01

The paper summarizes the studies on accelerated ion beams at ATOMKI and their technical background, their use from chemical analysis to biological, medical, geological, archaeological applications, their advance from material science to micromachining. (TRA)

Broad beam ion sources and some surface processes

International Nuclear Information System (INIS)

Neumann, H.; Scholze, F.; Tarz, M.; Schindler, A.; Wiese, R.; Nestler, M.; Blum, T.

2005-01-01

Modern broad-beam multi-aperture ion sources are widely used in material and surface technology applications. Customizing the generated ion beam properties (i. e. the ion current density profile) for specific demands of the application is a main challenge in the improvement of the ion beam technologies. First we introduce ion sources based on different plasma excitation principles shortly. An overview of source plasma and ion beam measurement methods deliver input data for modelling methods. This beam profile modelling using numerical trajectory codes and the validation of the results by Faraday cup measurements as a basis for ion beam profile design are described. Furthermore possibilities for ex situ and in situ beam profile control are demonstrated, like a special method for in situ control of a linear ion source beam profile, a grid modification for circular beam profile design and a cluster principle for broad beam sources. By means of these methods, the beam shape may be adapted to specific technological demands. Examples of broad beam source application in ion beam figuring of optical surfaces, modification of stainless steel, photo voltaic processes and deposition of EUVL-multilayer stacks are finally presented. (Author)

Cooling of molecular ion beams

International Nuclear Information System (INIS)

Wolf, A.; Krohn, S.; Kreckel, H.; Lammich, L.; Lange, M.; Strasser, D.; Grieser, M.; Schwalm, D.; Zajfman, D.

2004-01-01

An overview of the use of stored ion beams and phase space cooling (electron cooling) is given for the field of molecular physics. Emphasis is given to interactions between molecular ions and electrons studied in the electron cooler: dissociative recombination and, for internally excited molecular ions, electron-induced ro-vibrational cooling. Diagnostic methods for the transverse ion beam properties and for the internal excitation of the molecular ions are discussed, and results for phase space cooling and internal (vibrational) cooling are presented for hydrogen molecular ions

Space-charge compensation of highly charged ion beam from laser ion source

International Nuclear Information System (INIS)

Kondrashev, S.A.; Collier, J.; Sherwood, T.R.

1996-01-01

The problem of matching an ion beam delivered by a high-intensity ion source with an accelerator is considered. The experimental results of highly charged ion beam transport with space-charge compensation by electrons are presented. A tungsten thermionic cathode is used as a source of electrons for beam compensation. An increase of ion beam current density by a factor of 25 is obtained as a result of space-charge compensation at a distance of 3 m from the extraction system. The process of ion beam space-charge compensation, requirements for a source of electrons, and the influence of recombination losses in a space-charge-compensated ion beam are discussed. (author)

Ion-beam nanopatterning: experimental results with chemically-assisted beam

Science.gov (United States)

Pochon, Sebastien C. R.

2018-03-01

The need for forming gratings (for example used in VR headsets) in materials such as SiO2 has seen a recent surge in the use of Ion beam etching techniques. However, when using an argon-only beam, the selectivity is limited as it is a physical process. Typically, gases such as CHF3, SF6, O2 and Cl2 can be added to argon in order to increase selectivity; depending on where the gas is injected, the process is known as Reactive Ion Beam Etching (RIBE) or Chemically Assisted Ion Beam Etching (CAIBE). The substrate holder can rotate in order to provide an axisymmetric etch rate profile. It can also be tilted over a range of angles to the beam direction. This enables control over the sidewall profile as well as radial uniformity optimisation. Ion beam directionality in conjunction with variable incident beam angle via platen angle setting enables profile control and feature shaping during nanopatterning. These hardware features unique to the Ion Beam etching methods can be used to create angled etch features. The CAIBE technique is also well suited to laser diode facet etch (for optoelectronic devices); these typically use III-V materials like InP. Here, we report on materials such as SiO2 etched without rotation and at a fixed platen angle allowing the formation of gratings and InP etched at a fixed angle with rotation allowing the formation of nanopillars and laser facets.

Characterisation Of The Beam Plasma In High Current, Low Energy Ion Beams For Implanters

International Nuclear Information System (INIS)

Fiala, J.; Armour, D. G.; Berg, J. A. van der; Holmes, A. J. T.; Goldberg, R. D.; Collart, E. H. J.

2006-01-01

The effective transport of high current, positive ion beams at low energies in ion implanters requires the a high level of space charge compensation. The self-induced or forced introduction of electrons is known to result in the creation of a so-called beam plasma through which the beam propagates. Despite the ability of beams at energies above about 3-5 keV to create their own neutralising plasmas and the development of highly effective, plasma based neutralising systems for low energy beams, very little is known about the nature of beam plasmas and how their characteristics and capabilities depend on beam current, beam energy and beamline pressure. These issues have been addressed in a detailed scanning Langmuir probe study of the plasmas created in beams passing through the post-analysis section of a commercial, high current ion implanter. Combined with Faraday cup measurements of the rate of loss of beam current in the same region due to charge exchange and scattering collisions, the probe data have provided a valuable insight into the nature of the slow ion and electron production and loss processes. Two distinct electron energy distribution functions are observed with electron temperatures ≥ 25 V and around 1 eV. The fast electrons observed must be produced in their energetic state. By studying the properties of the beam plasma as a function of the beam and beamline parameters, information on the ways in which the plasma and the beam interact to reduce beam blow-up and retain a stable plasma has been obtained

In-air micro-pixe analysis of tissue samples

International Nuclear Information System (INIS)

Tanaka, A.; Ishii, K.; Komori, Y.

2002-01-01

Micro-PIXE is capable of providing spatial distributions of elements in the micro-meter scale and its application to biology is useful to elucidate the cellular metabolism. Since, in this method, a sample target is usually irradiated with proton or α-particle beams in vacuum, beam heating results in evaporation of volatile elements an shrinking of the sample. In order to avoid these side effects, we previously developed a technique of in-air micro-PIXE analysis for samples of cultured cells. In addition to these, analysis of exposed tissue samples from living subjects is highly desirable in biological and medical research. Here, we describe a technique of in-air micro-PIXE analysis of such tissue samples. The target samples of exposed tissue slices from a Donryu rat, in which a tumor had been transplanted, were analyzed with proton micro-beams of 2.6 MeV. We report that the shape of cells and the distribution of volatile elements in the tissue sample remain uncharged when using a target preparation based on a freeze-drying method. (author)

Maskless, resistless ion beam lithography

International Nuclear Information System (INIS)

Ji, Qing

2003-01-01

As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O 2 + , BF 2 + , P + etc., for surface modification and doping applications. With optimized source condition, around 85% of BF 2 + , over 90% of O 2 + and P + have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He + beam is as high as 440 A/cm 2 · Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O 2 + ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O 2 + ions with the dose of 10 15 cm -2 . The oxide can then serve as a hard mask for patterning of the Si film. The process flow and the experimental results for directly patterned poly-Si features are presented. The formation of shallow pn-junctions in bulk silicon wafers by scanning focused P

Fabrication of monolithic microfluidic channels in diamond with ion beam lithography

Science.gov (United States)

Picollo, F.; Battiato, A.; Boarino, L.; Ditalia Tchernij, S.; Enrico, E.; Forneris, J.; Gilardino, A.; Jakšić, M.; Sardi, F.; Skukan, N.; Tengattini, A.; Olivero, P.; Re, A.; Vittone, E.

2017-08-01

In the present work, we report on the monolithic fabrication by means of ion beam lithography of hollow micro-channels within a diamond substrate, to be employed for microfluidic applications. The fabrication strategy takes advantage of ion beam induced damage to convert diamond into graphite, which is characterized by a higher reactivity to oxidative etching with respect to the chemically inert pristine structure. This phase transition occurs in sub-superficial layers thanks to the peculiar damage profile of MeV ions, which mostly damage the target material at their end of range. The structures were obtained by irradiating commercial CVD diamond samples with a micrometric collimated C+ ion beam at three different energies (4 MeV, 3.5 MeV and 3 MeV) at a total fluence of 2 × 1016 cm-2. The chosen multiple-energy implantation strategy allows to obtain a thick box-like highly damaged region ranging from 1.6 μm to 2.1 μm below the sample surface. High-temperature annealing was performed to both promote the graphitization of the ion-induced amorphous layer and to recover the pristine crystalline structure in the cap layer. Finally, the graphite was removed by ozone etching, obtaining monolithic microfluidic structures. These prototypal microfluidic devices were tested injecting aqueous solutions and the evidence of the passage of fluids through the channels was confirmed by confocal fluorescent microscopy.

Production of ion beam by conical pinched electron beam diode

International Nuclear Information System (INIS)

Matsukawa, Y.; Nakagawa, Y.

1982-01-01

Some properties of the ion beam produced by pinched electron beam diode having conical shape electrodes and organic insulator anode was studied. Ion energy is about 200keV and the peak diode current is about 30 kA. At 11cm from the diode apex, not the geometrical focus point, concentrated ion beam was obtained. Its density is more than 500A/cm 2 . The mean ion current density within the radius of 1.6cm around the axis from conical diode is two or three times that from an usual pinched electron beam diode with flat parallel electrodes of same dimension and impedance under the same conditions. (author)

Diffuse ions produced by electromagnetic ion beam instabilities

International Nuclear Information System (INIS)

Winske, D.; Leroy, M.M.

1984-01-01

The evolution of the electromagnetic ions beam instability driven by the reflected ion component backstreaming away from the earth's how shock into the foreshock region is studied by means computer simulation. The linear the quasi-linear states of the instability are found to be in good agreement with known results for the resonant model propagating parallel to the beam along the magnetic field and with theory developed in this paper for the nonresonant mode, which propagates antiparallel to the beam direction. The quasi-linear stage, which produces large amplitude 8Bapprox.B, sinusoidal transverse waves and ''intermediate'' ion distribution, is terminated by a nonlinear phase in which strongly nonlinear, compressive waves and ''diffuse'' ion distributions are produced. Additional processes by which the diffuse ions are accelerated to observed high energies are not addressed. The results are discussed in terms of the ion distributions and hydromagnetic waves observed in the foreshock of the earth's bow shock and of interplanetary shocks

Assembling of a low energy ion beam analysis facility and use of Nuclear Microprobe techniques in geological studies

International Nuclear Information System (INIS)

Utui, R.

1996-11-01

In this work, both PIXE and ion beam induced luminescence, or just Ionoluminescence (IL) were used for geochemical studies. The possibility of rapid absolute quantification of elements in the ppm level by PIXE combined with the yet higher sensitivity of IL to transition metals and Rare Earth Elements (REE) activators, in the absence of quenching phenomena, allow for a synergic use of the two methods in geological applications with enhanced sensitivity. IL and PIXE were combined for studying REE distribution in apatite minerals and ion beam induced damage in inorganic material in general with emphasis to synthetically grown zircon crystals doped with REE. Due to the sensitivity of IL to changes in chemical bonding in the material, beam damage effects can be studied even at low integrated doses, through wavelength shift or fading of the induced light. Micro PIXE technique was used for studying profile concentrations of trace elements in pyrite grains and of elements used as geothermometers. Geothermometry allowed to assess the cooling rates in iron meteorites and the mineralization conditions in metamorphic rocks, attempting to describe the tectonic history of the terranes, with application in petrologic studies and geological prospecting. 148 refs

Assembling of a low energy ion beam analysis facility and use of Nuclear Microprobe techniques in geological studies

Energy Technology Data Exchange (ETDEWEB)

Utui, R

1996-11-01

In this work, both PIXE and ion beam induced luminescence, or just Ionoluminescence (IL) were used for geochemical studies. The possibility of rapid absolute quantification of elements in the ppm level by PIXE combined with the yet higher sensitivity of IL to transition metals and Rare Earth Elements (REE) activators, in the absence of quenching phenomena, allow for a synergic use of the two methods in geological applications with enhanced sensitivity. IL and PIXE were combined for studying REE distribution in apatite minerals and ion beam induced damage in inorganic material in general with emphasis to synthetically grown zircon crystals doped with REE. Due to the sensitivity of IL to changes in chemical bonding in the material, beam damage effects can be studied even at low integrated doses, through wavelength shift or fading of the induced light. Micro PIXE technique was used for studying profile concentrations of trace elements in pyrite grains and of elements used as geothermometers. Geothermometry allowed to assess the cooling rates in iron meteorites and the mineralization conditions in metamorphic rocks, attempting to describe the tectonic history of the terranes, with application in petrologic studies and geological prospecting. 148 refs.

Low energy ion beam systems for surface analytical and structural studies

International Nuclear Information System (INIS)

Nelson, G.C.

1980-01-01

This paper reviews the use of low energy ion beam systems for surface analytical and structural studies. Areas where analytical methods which utilize ion beams can provide a unique insight into materials problems are discussed. The design criteria of ion beam systems for performing materials studies are described and the systems now being used by a number of laboratories are reviewed. Finally, several specific problems are described where the solution was provided at least in part by information provided by low energy ion analysis techniques

Large area ion and plasma beam sources

Energy Technology Data Exchange (ETDEWEB)

Waldorf, J. [IPT Ionen- und Plasmatech. GmbH, Kaiserslautern (Germany)

1996-06-01

In the past a number of ion beam sources utilizing different methods for plasma excitation have been developed. Nevertheless, a widespread use in industrial applications has not happened, since the sources were often not able to fulfill specific demands like: broad homogeneous ion beams, compatibility with reactive gases, low ion energies at high ion current densities or electrical neutrality of the beam. Our contribution wants to demonstrate technical capabilities of rf ion and plasma beam sources, which can overcome the above mentioned disadvantages. The physical principles and features of respective sources are presented. We report on effective low pressure plasma excitation by electron cyclotron wave resonance (ECWR) for the generation of dense homogeneous plasmas and the rf plasma beam extraction method for the generation of broad low energy plasma beams. Some applications like direct plasma beam deposition of a-C:H and ion beam assisted deposition of Al and Cu with tailored thin film properties are discussed. (orig.).

Large area ion and plasma beam sources

International Nuclear Information System (INIS)

Waldorf, J.

1996-01-01

In the past a number of ion beam sources utilizing different methods for plasma excitation have been developed. Nevertheless, a widespread use in industrial applications has not happened, since the sources were often not able to fulfill specific demands like: broad homogeneous ion beams, compatibility with reactive gases, low ion energies at high ion current densities or electrical neutrality of the beam. Our contribution wants to demonstrate technical capabilities of rf ion and plasma beam sources, which can overcome the above mentioned disadvantages. The physical principles and features of respective sources are presented. We report on effective low pressure plasma excitation by electron cyclotron wave resonance (ECWR) for the generation of dense homogeneous plasmas and the rf plasma beam extraction method for the generation of broad low energy plasma beams. Some applications like direct plasma beam deposition of a-C:H and ion beam assisted deposition of Al and Cu with tailored thin film properties are discussed. (orig.)

The steering and manipulation of ion beams for low-energy heavy ion accelerators

International Nuclear Information System (INIS)

Beanland, D.G.; Freeman, J.H.

1976-01-01

Both electrostatic and magnetic fields are used in low-energy accelerators. Electrostatic fields are essential in the acceleration stages and they are commonly used for ion beam scanning and focussing. Magnetic fields are only infrequently used as lenses, but they are essential for mass analysis and are sometimes employed for beam steering. The electrostatic mirror is a versatile and compact lens which has hitherto received little attention for the controlled manipulation of heavy ions. In addition to energy analysis it can be used to steer, focus and scan such beams and its flexibility and usefulness can be further increased by shaping the electrostatic field in the mirror space. The use of a computer programme to model the focussing behaviour of a variety of lens shapes is described and it is shown that the focal properties of the mirror can be controlled to produce a parallel, convergent or divergent output beam. The use of mirrors for two-dimensional beam focusing is also outlined. To permit the use of the mirror system with heavy ions an apertured front plate, without field-defining gauzes, was utilized. In consequence an additional electrode was incorporated in the lens structure to prevent penetration of the positive electric field along the beam axes outside the mirror space. This factor and the compact design of the mirror, contributed to the minimisation of space-charge defocussing effects which normally militate against the use of such electrostatic lenses with high intensity ion beams. The results of experiments confirming the computer predictions are briefly described and, in conclusion some possible applications of electrostatic mirrors in electromagnetic isotope separators and low energy accelerators are outlined. (Auth.)

A research of possibility for negative muon production by a low energy electron beam accompanying ion beam

International Nuclear Information System (INIS)

Uramoto, Joshin.

1993-12-01

A low energy electron beam (≤ 2000 eV) is injected perpendicularly to a uniform magnetic field, together with a low energy positive ion beam. On this magnetic mass analysis (using the uniform magnetic field), a peak of secondary electron current to the beam collector (arranging as a mass analyzer of 90deg type), appears at an analyzing magnetic field which corresponds exactly to a relation of negative muon μ - (the mass m=207 m e and the charge q=e, where m e and e are mass and charge of electron). The ion beam is essential for the peak appearance, which is produced by decelerating electrically the electron beam in front of the entrance slit of the mass analyzer, and by introducing a neutral gas into the electron beam region and producing a plasma through the ionization. We consider that a very small amount of negative muons may be produced through local cyclotron motions of the injected beam electrons in the ion beam or by an interaction between the bunched beam electrons and beam ions. (author)

A comparative study on low-energy ion beam and neutralized beam modifications of naked DNA and biological effect on mutation

Science.gov (United States)

Sarapirom, S.; Thongkumkoon, P.; Prakrajang, K.; Anuntalabhochai, S.; Yu, L. D.

2012-02-01

DNA conformation change or damage induced by low-energy ion irradiation has been of great interest owing to research developments in ion beam biotechnology and ion beam application in biomedicine. Mechanisms involved in the induction of DNA damage may account for effect from implanting ion charge. In order to check this effect, we used both ion beam and neutralized beam at keV energy to bombard naked DNA. Argon or nitrogen ion beam was generated and extracted from a radiofrequency (RF) ion source and neutralized by microwave-driven plasma in the beam path. Plasmid DNA pGFP samples were irradiated with the ion or neutralized beam in vacuum, followed by gel electrophoresis to observe changes in the DNA conformations. It was revealed that the ion charge played a certain role in inducing DNA conformation change. The subsequent DNA transfer into bacteria Escherichia coli ( E. coli) for mutation analysis indicated that the charged ion beam induced DNA change had high potential in mutation induction while neutralized beam did not. The intrinsic reason was attributed to additional DNA deformation and contortion caused by ion charge exchange effect so that the ion beam induced DNA damage could hardly be completely repaired, whereas the neutralized beam induced DNA change could be more easily recoverable owing to absence of the additional DNA deformation and contortion.

A comparative study on low-energy ion beam and neutralized beam modifications of naked DNA and biological effect on mutation

International Nuclear Information System (INIS)

Sarapirom, S.; Thongkumkoon, P.; Prakrajang, K.; Anuntalabhochai, S.; Yu, L.D.

2012-01-01

DNA conformation change or damage induced by low-energy ion irradiation has been of great interest owing to research developments in ion beam biotechnology and ion beam application in biomedicine. Mechanisms involved in the induction of DNA damage may account for effect from implanting ion charge. In order to check this effect, we used both ion beam and neutralized beam at keV energy to bombard naked DNA. Argon or nitrogen ion beam was generated and extracted from a radiofrequency (RF) ion source and neutralized by microwave-driven plasma in the beam path. Plasmid DNA pGFP samples were irradiated with the ion or neutralized beam in vacuum, followed by gel electrophoresis to observe changes in the DNA conformations. It was revealed that the ion charge played a certain role in inducing DNA conformation change. The subsequent DNA transfer into bacteria Escherichia coli (E. coli) for mutation analysis indicated that the charged ion beam induced DNA change had high potential in mutation induction while neutralized beam did not. The intrinsic reason was attributed to additional DNA deformation and contortion caused by ion charge exchange effect so that the ion beam induced DNA damage could hardly be completely repaired, whereas the neutralized beam induced DNA change could be more easily recoverable owing to absence of the additional DNA deformation and contortion.

Ion-beam texturing of uniaxially textured Ni films

International Nuclear Information System (INIS)

Park, S.J.; Norton, D.P.; Selvamanickam, Venkat

2005-01-01

The formation of biaxial texture in uniaxially textured Ni thin films via Ar-ion irradiation is reported. The ion-beam irradiation was not simultaneous with deposition. Instead, the ion beam irradiates the uniaxially textured film surface with no impinging deposition flux, which differs from conventional ion-beam-assisted deposition. The uniaxial texture is established via a nonion beam process, with the in-plane texture imposed on the uniaxial film via ion beam bombardment. Within this sequential ion beam texturing method, grain alignment is driven by selective etching and grain overgrowth

Determination of the meniscus shape of a negative ion beam from an experimentally obtained beam profile

Science.gov (United States)

Ichikawa, M.; Kojima, A.; Chitarin, G.; Agostinetti, P.; Aprile, D.; Baltador, C.; Barbisan, M.; Delogu, R.; Hiratsuka, J.; Marconato, N.; Nishikiori, R.; Pimazzoni, A.; Sartori, E.; Serianni, G.; Tobari, H.; Umeda, N.; Veltri, P.; Watanabe, K.; Yoshida, M.; Antoni, V.; Kashiwagi, M.

2017-08-01

In order to understand the physics mechanism of a negative ion extraction in negative ion sources, an emission surface of the negative ions around an aperture at a plasma grid, so-called a meniscus, has been analyzed by an inverse calculation of the negative ion trajectory in a two dimensional beam analysis code. In this method, the meniscus is defined as the final position of the negative ion trajectories which are inversely calculated from the measured beam profile to the plasma grid. In a case of the volume-produced negative ions, the calculated meniscus by the inverse calculation was similar to that obtained in conventional beam simulation codes for positive ion extractions such as BEAMORBT and SLACCAD. The negative ion current density was uniform along the meniscus. This indicates that the negative ions produced in the plasma are transported to the plasma grid uniformly as considered in the transportation of the positive ions. However, in a surface production case of negative ions, where the negative ions are generated near the plasma grid with lower work function by seeding cesium, the current density in the peripheral region of the meniscus close to the plasma grid surface was estimated to be 2 times larger than the center region, which suggested that the extraction process of the surface-produced negative ions was much different with that for the positive ions. Because this non-uniform profile of the current density made the meniscus shape strongly concave, the beam extracted from the peripheral region could have a large divergence angle, which might be one of origins of so-called beam halo. This is the first results of the determination of the meniscus based on the experiment, which is useful to improve the prediction of the meniscus shape and heat loads based on the beam trajectories including beam halo.

Applications of capillary optics for focused ion beams

International Nuclear Information System (INIS)

Umezawa, Kenji

2014-01-01

This article introduces applications of focused ion beams (∼1 μm) with glass capillaries systems. A first report on the interaction between ion beams and glass capillaries was published in 1996. The guiding capabilities of glass capillaries were discovered due to ion reflection from inner wall of glass surfaces. Meanwhile, the similar optics have been already realized in focusing X-rays using glass capillaries. The basic technology of X-rays optics using glass capillaries had been developed in the 1980's and 1900's. Also, low energy atom scattering spectroscopy for insulator material analysis will be mentioned. (author)

Development of a single ion micro-irradiation facility for experimental radiobiology at cell level; Developpement d'une ligne d'irradiation microfaisceau en mode ion par ion pour la radiobiologie experimentale a l'echelle cellulaire

Energy Technology Data Exchange (ETDEWEB)

Barberet, Ph

2003-10-01

A micro-irradiation device has been developed for radiobiology applications at the scale of the cell. This device is based on an upgrade of an existing micro-beam line that was already able to deliver a 1 to 3 MeV proton or alpha beam of low intensity and whose space resolution is lower than 1 micrometer in vacuum. The important part of this work has been the development of an irradiation stage designed to fit on the micro-probe and able to deliver ions in the air with an absolute accuracy of a few micrometers. A program has been set up to monitor the complete irradiation line in testing and in automatic irradiation operating phases. Simulation tools based on Monte-Carlo calculations have been validated through comparisons with experimental data particularly in the field of spatial resolution and of the number of ions delivered. The promising results show the possibility in a near future to use this tool to study the response of cells to very low irradiation doses down to the extreme limit of one ion per cell.

Beam losses in heavy ion drivers

CERN Document Server

Mustafin, E R; Hofmann, I; Spiller, P J

2002-01-01

While beam loss issues have hardly been considered in detail for heavy ion fusion scenarios, recent heavy ion machine developments in different labs (European Organization for Nuclear Research (CERN), Gesellschaft fur Schwerionenforschung (GSI), Institute for Theoretical and Experimental Physics (ITEP), Relativistic Heavy-Ion Collider (RHIC)) have shown the great importance of beam current limitations due to ion losses. Two aspects of beam losses in heavy ion accelerators are theoretically considered: (1) secondary neutron production due to lost ions, and (2) vacuum pressure instability due to charge exchange losses. Calculations are compared and found to be in good agreement with measured data. The application to a Heavy-Ion Driven Inertial Fusion (HIDIF) scenario is discussed. 12 Refs.

Modification of semiconductors with proton beams. A review

International Nuclear Information System (INIS)

Kozlovskii, V.V.; Lomasov, V.N.; Kozlov, V.A.

2000-01-01

Analysis is given of the progress in the modification of semiconductors by proton beams in fields such as proton-enhanced diffusion, ion-beam mixing, and formation of porous layers. This method of modification (doping) is shown to have high potential in monitoring the properties of semiconductor materials and designing devices of micro and nano electronics as compared to the conventional doping techniques such as thermal diffusion, epitaxy, and ion implantation

Ion source for ion beam deposition employing a novel electrode assembly

Science.gov (United States)

Hayes, A. V.; Kanarov, V.; Yevtukhov, R.; Hegde, H.; Druz, B.; Yakovlevitch, D.; Cheesman, W.; Mirkov, V.

2000-02-01

A rf inductively coupled ion source employing a novel electrode assembly for focusing a broad ion beam on a relatively small target area was developed. The primary application of this ion source is the deposition of thin films used in the fabrication of magnetic sensors and optical devices. The ion optics consists of a three-electrode set of multiaperture concave dished grids with a beam extraction diameter of 150 mm. Also described is a variation in the design providing a beam extraction diameter of 120 mm. Grid hole diameters and grid spacing were optimized for low beamlet divergence and low grid impingement currents. The radius of curvature of the grids was optimized to obtain an optimally focused ion beam at the target location. A novel grid fabrication and mounting design was employed which overcomes typical limitations of such grid assemblies, particularly in terms of maintaining optimum beam focusing conditions after multiple cycles of operation. Ion beam generation with argon and xenon gases in energy ranges from 0.3 to 2.0 keV was characterized. For operation with argon gas, beam currents greater than 0.5 A were obtained with a beam energy of 800 eV. At optimal beam formation conditions, beam profiles at distances about equal to the radius of curvature were found to be close to Gaussian, with 99.9% of the beam current located within a 150 mm target diameter. Repeatability of the beam profile over long periods of operation is also reported.

Maskless, resistless ion beam lithography

Energy Technology Data Exchange (ETDEWEB)

Ji, Qing [Univ. of California, Berkeley, CA (United States)

2003-01-01

As the dimensions of semiconductor devices are scaled down, in order to achieve higher levels of integration, optical lithography will no longer be sufficient for the needs of the semiconductor industry. Alternative next-generation lithography (NGL) approaches, such as extreme ultra-violet (EUV), X-ray, electron-beam, and ion projection lithography face some challenging issues with complicated mask technology and low throughput. Among the four major alternative NGL approaches, ion beam lithography is the only one that can provide both maskless and resistless patterning. As such, it can potentially make nano-fabrication much simpler. This thesis investigates a focused ion beam system for maskless, resistless patterning that can be made practical for high-volume production. In order to achieve maskless, resistless patterning, the ion source must be able to produce a variety of ion species. The compact FIB system being developed uses a multicusp plasma ion source, which can generate ion beams of various elements, such as O₂⁺, BF₂⁺, P⁺ etc., for surface modification and doping applications. With optimized source condition, around 85% of BF₂⁺, over 90% of O₂⁺ and P⁺ have been achieved. The brightness of the multicusp-plasma ion source is a key issue for its application to maskless ion beam lithography. It can be substantially improved by optimizing the source configuration and extractor geometry. Measured brightness of 2 keV He⁺ beam is as high as 440 A/cm² • Sr, which represents a 30x improvement over prior work. Direct patterning of Si thin film using a focused O₂⁺ ion beam has been investigated. A thin surface oxide film can be selectively formed using 3 keV O₂⁺ ions with the dose of 10¹⁵ cm^-2. The oxide can then serve as a hard mask for patterning of the Si film. The

Development of a Reference Database for Ion Beam Analysis. Report of a Coordinated Research Project on Reference Database for Ion Beam Analysis

International Nuclear Information System (INIS)

2015-12-01

Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. The applications of such techniques are diverse and include environmental control, cultural heritage and conservation and fusion technologies. Their reliability and accuracy depends strongly on our knowledge of the nuclear reaction cross sections, and this publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques and make these data available to the user community through a comprehensive online database. It includes detailed assessments of experimental cross sections as well as attempts to benchmark these data against appropriate integral measurements

Ion Beam Extraction by Discrete Ion Focusing

DEFF Research Database (Denmark)

2010-01-01

An apparatus (900) and methods are disclosed for ion beam extraction. In an implementation, the apparatus includes a plasma source (or plasma) (802) and an ion extractor (804). The plasma source is adapted to generate ions and the ion extractor is immersed in the plasma source to extract a fracti...

ECR ion source based low energy ion beam facility

Indian Academy of Sciences (India)

Mass analyzed highly charged ion beams of energy ranging from a few keV to a few MeV plays an important role in various aspects of research in modern physics. In this paper a unique low energy ion beam facility (LEIBF) set up at Nuclear Science Centre (NSC) for providing low and medium energy multiply charged ion ...

Intense pulsed heavy ion beam technology

International Nuclear Information System (INIS)

Masugata, Katsumi; Ito, Hiroaki

2010-01-01

Development of intense pulsed heavy ion beam accelerator technology is described for the application of materials processing. Gas puff plasma gun and vacuum arc discharge plasma gun were developed as an active ion source for magnetically insulated pulsed ion diode. Source plasma of nitrogen and aluminum were successfully produced with the gas puff plasma gun and the vacuum arc plasma gun, respectively. The ion diode was successfully operated with gas puff plasma gun at diode voltage 190 kV, diode current 2.2 kA and nitrogen ion beam of ion current density 27 A/cm 2 was obtained. The ion composition was evaluated by a Thomson parabola spectrometer and the purity of the nitrogen ion beam was estimated to be 86%. The diode also operated with aluminum ion source of vacuum arc plasma gun. The ion diode was operated at 200 kV, 12 kA, and aluminum ion beam of current density 230 A/cm 2 was obtained. The beam consists of aluminum ions (Al (1-3)+ ) of energy 60-400 keV, and protons (90-130 keV), and the purity was estimated to be 89%. The development of the bipolar pulse accelerator (BPA) was reported. A double coaxial type bipolar pulse generator was developed as the power supply of the BPA. The generator was tested with dummy load of 7.5 ohm, bipolar pulses of -138 kV, 72 ns (1st pulse) and +130 kV, 70 ns (2nd pulse) were successively generated. By applying the bipolar pulse to the drift tube of the BPA, nitrogen ion beam of 2 A/cm 2 was observed in the cathode, which suggests the bipolar pulse acceleration. (author)

High repetition rate intense ion beam source

International Nuclear Information System (INIS)

Hammer, D.A.; Glidden, S.C.; Noonan, B.

1992-01-01

This final report describes a ≤ 150kV, 40kA, 100ns high repetition rate pulsed power system and intense ion beam source which is now in operation at Cornell University. Operation of the Magnetically-controlled Anode Plasma (MAP) ion diode at > 100Hz (burst mode for up to 10 pulse bursts) provides an initial look at repetition rate limitations of both the ion diode and beam diagnostics. The pulsed power systems are capable of ≥ 1kHz operation (up to 10 pulse bursts), but ion diode operation was limited to ∼100Hz because of diagnostic limitations. By varying MAP diode operating parameters, ion beams can be extracted at a few 10s of keV or at up to 150keV, the corresponding accelerating gap impedance ranging from about 1Ω to about 10Ω. The ability to make hundreds of test pulses per day at an average repetition rate of about 2 pulses per minute permits statistical analysis of diode operation as a function of various parameters. Most diode components have now survived more than 10 4 pulses, and the design and construction of the various pulsed power components of the MAP diode which have enabled us to reach this point are discussed. A high speed data acquisition system and companion analysis software capable of acquiring pulse data at 1ms intervals (in bursts of up to 10 pulses) and processing it in ≤ min is described

Spontaneous decoration of Au nanoparticles on micro-patterned reduced graphene oxide shaped by focused laser beam

International Nuclear Information System (INIS)

Wan, Y. C.; Tok, E. S.; Teoh, H. F.; Sow, C. H.

2015-01-01

We report a facile, two-step method for the micro-landscaping of Au nanoparticles(NPs) on reduced graphene oxide (rGO) film en route to micro-patterned Au(NPs)-rGO hybrid functional materials. This method employs a focused laser beam to first locally convert GO to rGO before immersing the micro-patterned GO-rGO film into HAuCl 4 solution. The rGO micro-pattern, shaped by the focused laser beam, serves as nucleation sites for the reduction of Au ions. The reduction mechanism that governs the decoration of Au NPs on rGO films is akin to electroless deposition process. In this instance, surface charges that are formed during laser reduction of GO to rGO provide active nucleation sites for Au 3+ ions to form Au NPs when HAuCl 4 solution is introduced. The number density, the size, and size distribution of the Au NPs can thus be directly tuned and preferentially anchored onto the rGO micro-pattern by varying the incident laser power, the scanning speed of the laser, or the concentration of HAuCl 4 . The resulting hybrid materials can be used as a substrate for Surface Enhanced Raman Spectroscopy (SERS). Using Rhodamine 6G as the test subject, we found an improvement of SERS enhancement over bare rGO of up to four times, depending on the size of the Au NPs

Spontaneous decoration of Au nanoparticles on micro-patterned reduced graphene oxide shaped by focused laser beam

Energy Technology Data Exchange (ETDEWEB)

Wan, Y. C.; Tok, E. S. [Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117542 (Singapore); Teoh, H. F. [Graduate School of Integrative Sciences and Engineering, National University of Singapore, 28 Medical Drive, Singapore 117456 (Singapore); Sow, C. H. [Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore 117542 (Singapore); Graduate School of Integrative Sciences and Engineering, National University of Singapore, 28 Medical Drive, Singapore 117456 (Singapore)

2015-02-07

We report a facile, two-step method for the micro-landscaping of Au nanoparticles(NPs) on reduced graphene oxide (rGO) film en route to micro-patterned Au(NPs)-rGO hybrid functional materials. This method employs a focused laser beam to first locally convert GO to rGO before immersing the micro-patterned GO-rGO film into HAuCl{sub 4} solution. The rGO micro-pattern, shaped by the focused laser beam, serves as nucleation sites for the reduction of Au ions. The reduction mechanism that governs the decoration of Au NPs on rGO films is akin to electroless deposition process. In this instance, surface charges that are formed during laser reduction of GO to rGO provide active nucleation sites for Au{sup 3+} ions to form Au NPs when HAuCl{sub 4} solution is introduced. The number density, the size, and size distribution of the Au NPs can thus be directly tuned and preferentially anchored onto the rGO micro-pattern by varying the incident laser power, the scanning speed of the laser, or the concentration of HAuCl{sub 4}. The resulting hybrid materials can be used as a substrate for Surface Enhanced Raman Spectroscopy (SERS). Using Rhodamine 6G as the test subject, we found an improvement of SERS enhancement over bare rGO of up to four times, depending on the size of the Au NPs.

High-intensity laser-accelerated ion beam produced from cryogenic micro-jet target

Energy Technology Data Exchange (ETDEWEB)

Gauthier, M., E-mail: maxence.gauthier@stanford.edu; Kim, J. B.; Curry, C. B.; Gamboa, E. J.; Göde, S.; Propp, A.; Glenzer, S. H. [SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Aurand, B.; Willi, O. [Heinrich-Heine-University Düsseldorf, Düsseldorf (Germany); Goyon, C.; Hazi, A.; Pak, A.; Ruby, J.; Williams, G. J. [Lawrence Livermore National Laboratory, Livermore, California 94551 (United States); Kerr, S. [University of Alberta, Edmonton, Alberta T6G 1R1 (Canada); Ramakrishna, B. [Indian Institute of Technology, Hyderabad (India); Rödel, C. [SLAC National Accelerator Laboratory, Menlo Park, California 94025 (United States); Friedrich-Schiller-University Jena, Jena (Germany)

2016-11-15

We report on the successful operation of a newly developed cryogenic jet target at high intensity laser-irradiation. Using the frequency-doubled Titan short pulse laser system at Jupiter Laser Facility, Lawrence Livermore National Laboratory, we demonstrate the generation of a pure proton beam a with maximum energy of 2 MeV. Furthermore, we record a quasi-monoenergetic peak at 1.1 MeV in the proton spectrum emitted in the laser forward direction suggesting an alternative acceleration mechanism. Using a solid-density mixed hydrogen-deuterium target, we are also able to produce pure proton-deuteron ion beams. With its high purity, limited size, near-critical density, and high-repetition rate capability, this target is promising for future applications.

The JANNUS Saclay facility: A new platform for materials irradiation, implantation and ion beam analysis

Energy Technology Data Exchange (ETDEWEB)

Pellegrino, S., E-mail: stephanie.pellegrino@cea.fr [CEA, INSTN, UEPTN, Laboratoire JANNUS, F-91191 Gif-sur-Yvette (France); Trocellier, P.; Miro, S.; Serruys, Y.; Bordas, E.; Martin, H. [CEA, DEN, Service de Recherches de Metallurgie Physique, Laboratoire JANNUS, F-91191 Gif-sur-Yvette (France); Chaabane, N.; Vaubaillon, S. [CEA, INSTN, UEPTN, Laboratoire JANNUS, F-91191 Gif-sur-Yvette (France); Gallien, J.P.; Beck, L. [CEA, DEN, Service de Recherches de Metallurgie Physique, Laboratoire JANNUS, F-91191 Gif-sur-Yvette (France)

2012-02-15

The third accelerator of the multi-ion irradiation platform JANNUS (Joint Accelerators for Nanosciences and NUclear Simulation), a 6SDH-2 Pelletron from National Electrostatic Corporation, Middleton was installed at Saclay in October 2009. The first triple beam irradiation combining Fe, He and H ion beams has been performed in March 2010. In the first part of this paper, we give a technical description of the triple beam facility, its performances and experimental capabilities. Typically, damage dose up to 100 dpa can be reached in 10 h irradiation with heavy ion beams, with or without simultaneous bombardment by protons, helium-4 ions or any other heavy ion beam. In the second part of this paper, we illustrate some IBA results obtained after irradiation and implantation experiments.

Individual addressing of trapped {sup 171}Yb{sup +} ion qubits using a microelectromechanical systems-based beam steering system

Energy Technology Data Exchange (ETDEWEB)

Crain, S.; Mount, E.; Baek, S.; Kim, J., E-mail: jungsang@duke.edu [Electrical and Computer Engineering Department, Fitzpatrick Institute for Photonics, Duke University, Durham, North Carolina 27708 (United States)

2014-11-03

The ability to individually manipulate the increasing number of qubits is one of the many challenges towards scalable quantum information processing with trapped ions. Using micro-mirrors fabricated with micro-electromechanical systems technology, we focus laser beams on individual ions in a linear chain and steer the focal point in two dimensions. We demonstrate sequential single qubit gates on multiple {sup 171}Yb{sup +} qubits and characterize the gate performance using quantum state tomography. Our system features negligible crosstalk to neighboring ions (<3×10{sup −4}), and switching speed comparable to typical single qubit gate times (<2 μs)

Advancement of highly charged ion beam production by superconducting ECR ion source SECRAL (invited)

International Nuclear Information System (INIS)

Sun, L.; Lu, W.; Zhang, W. H.; Feng, Y. C.; Qian, C.; Ma, H. Y.; Zhang, X. Z.; Zhao, H. W.; Guo, J. W.; Yang, Y.; Fang, X.

2016-01-01

At Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS), the superconducting Electron Cyclotron Resonance (ECR) ion source SECRAL (Superconducting ECR ion source with Advanced design in Lanzhou) has been put into operation for about 10 years now. It has been the main working horse to deliver intense highly charged heavy ion beams for the accelerators. Since its first plasma at 18 GHz, R&D work towards more intense highly charged ion beam production as well as the beam quality investigation has never been stopped. When SECRAL was upgraded to its typical operation frequency 24 GHz, it had already showed its promising capacity of very intense highly charged ion beam production. And it has also provided the strong experimental support for the so called scaling laws of microwave frequency effect. However, compared to the microwave power heating efficiency at 18 GHz, 24 GHz microwave heating does not show the ω 2 scale at the same power level, which indicates that microwave power coupling at gyrotron frequency needs better understanding. In this paper, after a review of the operation status of SECRAL with regard to the beam availability and stability, the recent study of the extracted ion beam transverse coupling issues will be discussed, and the test results of the both TE 01 and HE 11 modes will be presented. A general comparison of the performance working with the two injection modes will be given, and a preliminary analysis will be introduced. The latest results of the production of very intense highly charged ion beams, such as 1.42 emA Ar 12+ , 0.92 emA Xe 27+ , and so on, will be presented

Consideration of beam plasma ion-source

International Nuclear Information System (INIS)

Sano, Fumimichi; Kusano, Norimasa; Ishida, Yoshihiro; Ishikawa, Junzo; Takagi, Toshinori

1976-01-01

Theoretical and experimental analyses and their comparison were made on the plasma generation and on the beam extraction for the beam plasma ion-source. The operational principle and the structure of the ion-source are explained in the first part. Considerations are given on the electron beam-plasma interaction and the resulting generation of high frequency or microwaves which in turn increases the plasma density. The flow of energy in this system is also explained in the second part. The relation between plasma density and the imaginary part of frequency is given by taking the magnetic flux density, the electron beam energy, and the electron beam current as parameters. The relations between the potential difference between collector and drift tube and the plasma density or the ion-current are also given. Considerations are also given to the change of the plasma density due to the change of the magnetic flux density at drift tube, the change of the electron beam energy, and the change of the electron beam current. The third part deals with the extraction characteristics of the ion beam. The structure of the multiple-aperture electrode and the relation between plasma density and the extracted ion current are explained. (Aoki, K.)

Scintillation screen materials for beam profile measurements of high energy ion beams

Energy Technology Data Exchange (ETDEWEB)

Krishnakumar, Renuka

2016-06-22

For the application as a transverse ion beam diagnostics device, various scintillation screen materials were analysed. The properties of the materials such as light output, image reproduction and radiation stability were investigated with the ion beams extracted from heavy ion synchrotron SIS-18. The ion species (C, Ne, Ar, Ta and U) were chosen to cover the large range of elements in the periodic table. The ions were accelerated to the kinetic energies of 200 MeV/u and 300 MeV/u extracted with 300 ms pulse duration and applied to the screens. The particle intensity of the ion beam was varied from 10{sup 4} to 10{sup 9} particles per pulse. The screens were irradiated with typically 40 beam pulses and the scintillation light was captured using a CCD camera followed by characterization of the beam spot. The radiation hardness of the screens was estimated with high intensity Uranium ion irradiation. In the study, a linear light output for 5 orders of magnitude of particle intensities was observed from sensitive scintillators and ceramic screens such as Al{sub 2}O{sub 3}:Cr and Al{sub 2}O{sub 3}. The highest light output was recorded by CsI:Tl and the lowest one by Herasil. At higher beam intensity saturation of light output was noticed from Y and Mg doped ZrO{sub 2} screens. The light output from the screen depends not only on the particle intensity but also on the ion species used for irradiation. The light yield (i.e. the light intensity normalised to the energy deposition in the material by the ion) is calculated from the experimental data for each ion beam setting. It is shown that the light yield for light ions is about a factor 2 larger than the one of heavy ions. The image widths recorded exhibit a dependence on the screens material and differences up to 50 % were registered. On radiation stability analysis with high particle intensity of Uranium ions of about 6 x 10{sup 8} ppp, a stable performance in light output and image reproduction was documented from Al

Modified betatron for ion beam fusion

International Nuclear Information System (INIS)

Rostoker, N.; Fisher, A.

1986-01-01

An intense neutralized ion beam can be injected and trapped in magnetic mirror or tokamak geometry. The details of the process involve beam polarization so that the beam crosses the fringing fields without deflection and draining the polarization when the beam reaches the plasma. Equilibrium requires that a large betatron field be added in tokamak geometry. In mirror geometry a toroidal field must be added by means of a current along the mirror axis. In either case, the geometry becomes that of the modified betatron which has been studied experimentally and theoretically in recent years. We consider beams of d and t ions with a mean energy of 500 kev and a temperature of about 50 kev. The plasma may be a proton plasma with cold ions. It is only necessary for beam trapping or to carry currents. The ion energy for slowing down is initially 500 kev and thermonuclear reactions depend only on the beam temperature of 50 kev which changes very slowly. This new configuration for magnetic confinement fusion leads to an energy gain of 10--20 for d-t reactions whereas previous studies of beam target interaction predicted a maximum energy gain of 3--4. The high beam energy available with pulsed ion diode technology is also essential for advanced fuels. 16 refs., 3 figs

Generation and focusing of intense ion beams with an inverse pinch ion diode

International Nuclear Information System (INIS)

Hashimoto, Yoshiyuki; Sato, Morihiko; Yatsuzuka, Mitsuyasu; Nobuhara, Sadao

1992-01-01

Generation and focusing of ion beams using an inverse pinch ion diode with a flat anode has been studied. The ion beams generated with the inverse pinch ion diode were found to be focused at 120 mm from the anode by the electrostatic field in the diode. The energy and maximum current density of the ion beams were 180 keV and 420 A/cm 2 , respectively. The focusing angle of the ion beams was 4.3deg. The beam brightness was estimated to be 1.3 GW/cm 2 ·rad 2 . The focusing distance of the ion beams was found to be controllable by changing the diameters of the anode and cathode. (author)

Prospects of ion implantation and ion beam mixing for corrosion protection

International Nuclear Information System (INIS)

Wolf, G.K.; Munn, P.; Ensinger, W.

1985-01-01

Ion implantation is very useful new low temperature treatment for improving the mechanical surface properties of materials without any dimensional changes. In addition also the corrosion properties of metals can be modified considerably by this technique. The long term corrosion behaviour of implanted metals, however, has been studied only for a very limited number of cases. In this contribution a survey of attempts to do this will be presented. As examples of promising systems for corrosion protection by ion beams iron, steel and titanium were examined with and without pretreatment by ion implantation and ion beam mixing. The corrosion rates of the systems have been obtained by neutron activation analysis and by electrochemical methods. Experimental results are presented on: Palladium implanted in titanium - crevice corrosion in salt solution; Palladium implanted in and deposited on titanium -corrosion in sulfuric acid; Platinum implanted in stainless steel -corrosion in sulfuric acid. (author)

Construction of a scattering chamber for ion-beam analysis of environmental materials in undergraduate physics research

Energy Technology Data Exchange (ETDEWEB)

LaBrake, Scott M.; Vineyard, Michael F.; Turley, Colin F.; Moore, Robert D.; Johnson, Christopher [Department of Physics and Astronomy Union College, Schenectady, NY 12308 (United States)

2013-04-19

We have developed a new scattering chamber for ion-beam analysis of environmental materials with the 1.1-MV Pelletron accelerator at the Union College Ion-Beam Analysis Laboratory. The chamber was constructed from a ten-inch, Conflat, multi-port cross and includes a three-axis target manipulator and target ladder assembly, an eight-inch turbo pump, an Amptek X-ray detector, and multiple charged particle detectors. Recent projects performed by our undergraduate research team include proton induced X-ray emission (PIXE) and Rutherford backscattering (RBS) analyses of atmospheric aerosols collected with a nine-stage cascade impactor in Upstate New York. We will describe the construction of the chamber and discuss the results of some commissioning experiments.

Cooled heavy ion beams at the ESR

International Nuclear Information System (INIS)

Steck, M.; Beckert, K.; Bosch, F.; Eickhoff, H.; Franzke, B.; Klepper, O.; Nolden, F.; Reich, H.; Schlitt, B.; Spaedtke, P.; Winkler, T.

1996-01-01

The storage ring ESR has been used in various operational modes for experiments with electron cooled heavy ion beams. Besides the standard storage mode including injection and beam accumulation the deceleration of highly charged ions has been demonstrated. Beams of highly charged ions have been injected and accumulated and finally decelerated to a minimum energy of 50 MeV/u. An ultraslow extraction method using charge changing processes is now also available for cooled beams of highly charged ions. For in ring experiments the internal gas jet and the cold electron beam of the cooling system are applied as targets. High precision mass spectrometry by Schottky noise detection has been demonstrated. Operation at transition energy has been achieved with cooled beams opening the field for experiments which require an isochronous revolution of the ions. (orig.)

A beam profile monitor for heavy ion beams at high impact energies

International Nuclear Information System (INIS)

Hausmann, A.; Stiebing, K.E.; Bethge, K.; Froehlich, O.; Koehler, E.; Mueller, A.; Rueschmann, G.

1994-01-01

A beam profile monitor for heavy ion beams has been developed for the use in experiments at the Heavy Ion Synchrotron SIS at Gesellschaft fuer Schwerionenforschung Darmstadt (GSI). Four thin scintillation fibres are mounted on one wheel and scan the ion beam sequentially in two linearly independent directions. They are read out via one single photomultiplier common to all four fibres into one time spectrum, which provides all information about beam position, beam extension, time structure and lateral homogeneity of the beam. The system operates in a wide dynamic range of beam intensities. ((orig.))

Intense beams of light ions

International Nuclear Information System (INIS)

Camarcat, Noel

1985-01-01

Results of experiments performed in order to accelerate intense beams of light and heavier ions are presented. The accelerating diodes are driven by existing pulsed power generators. Optimization of the generator structure is described in chapter I. Nuclear diagnostics of the accelerated light ion beams are presented in chapter II. Chapter III deals with the physics of intense charged particle beams. The models developed are applied to the calculation of the performances of the ion diodes described in the previous chapters. Chapter IV reports preliminary results on a multiply ionized carbon source driven by a 0.1 TW pulsed power generator. (author) [fr

Constraints on ion beam handling for intersecting beam experiments

International Nuclear Information System (INIS)

Kruse, T.

1981-01-01

The intense synchrotron radiation beams from the NSLS uv or x-ray storage rings still do not compare in monochromatized photon flux with a laser beam, a fact which becomes apparent in considering reaction rates for interaction of photon and ion beams. There are two prototypical interaction geometries, parallel and perpendicular. Calculations should properly be done in the rest frame of the ion beam; however, expected beta values are small, so the lab frame will be employed and aberration and Doppler shift effects neglected

Ion beam modification and analysis of thin YBa2Cu3O7 films

International Nuclear Information System (INIS)

Meyer, O.

1989-04-01

The application of ion beams for the analysis and modification of high Tc superconductors is reviewed. Ion backscattering and channeling spectroscopy is used to optimize the film composition and the epitaxial growth performance on various single crystalline substrates. The influence of radiation damage on the transport properties and on the structure of polycrystalline as well as of single crystalline thin films is presented. The irradiation induced metal to insulator phase transition is discussed in detail. Some applications including the use of ion implantation for structuring are summarized. (orig.) [de

Measurement of ultra-low ion energy of decelerated ion beam using a deflecting electric field

Energy Technology Data Exchange (ETDEWEB)

Thopan, P.; Suwannakachorn, D.; Tippawan, U. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Yu, L.D., E-mail: yuld@thep-center.org [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)

2015-12-15

In investigation on ultra-low-energy ion bombardment effect on DNA, an ion beam deceleration lens was developed for high-quality ultra-low-energy ion beam. Measurement of the ion energy after deceleration was necessary to confirm the ion beam really decelerated as theoretically predicted. In contrast to conventional methods, this work used a simple deflecting electrostatic field after the deceleration lens to bend the ion beam. The beam bending distance depended on the ion energy and was described and simulated. A system for the measurement of the ion beam energy was constructed. It consisted of a pair of parallel electrode plates to generate the deflecting electrical field, a copper rod measurement piece to detect ion beam current, a vernier caliper to mark the beam position, a stepping motor to translate the measurement rod, and a webcam-camera to read the beam bending distance. The entire system was installed after the ion-beam deceleration lens inside the large chamber of the bioengineering vertical ion beam line. Moving the measurement rod across the decelerated ion beam enabled to obtain beam profiles, from which the beam bending distance could be known and the ion beam energy could be calculated. The measurement results were in good agreement with theoretical and simulated results.

An ion beam deceleration lens for ultra-low-energy ion bombardment of naked DNA

Energy Technology Data Exchange (ETDEWEB)

Thopan, P.; Prakrajang, K. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thongkumkoon, P. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand); Suwannakachorn, D. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Yu, L.D., E-mail: yuldyuld@gmail.com [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)

2013-07-15

Highlights: ► An ion beam deceleration lens was designed and constructed. ► The deceleration lens was installed and tested. ► The decelerated ion beam energy was measured using an electrical field. ► Decelerated ultra-low-energy ion beam bombarded naked DNA. ► Ion beam with energy of a few tens of eV could break DNA strands. -- Abstract: Study of low-energy ion bombardment effect on biological living materials is of significance. High-energy ion beam irradiation of biological materials such as organs and cells has no doubt biological effects. However, ion energy deposition in the ion-bombarded materials dominantly occurs in the low-energy range. To investigate effects from very-low-energy ion bombardment on biological materials, an ion beam deceleration lens is necessary for uniform ion energy lower than keV. A deceleration lens was designed and constructed based on study of the beam optics using the SIMION program. The lens consisted of six electrodes, able to focus and decelerate primary ion beam, with the last one being a long tube to obtain a parallel uniform exiting beam. The deceleration lens was installed to our 30-kV bioengineering-specialized ion beam line. The final decelerated-ion energy was measured using a simple electrostatic field to bend the beam to range from 10 eV to 1 keV controlled by the lens parameters and the primary beam condition. In a preliminary test, nitrogen ion beam at 60 eV decelerated from a primary 20-keV beam bombarded naked plasmid DNA. The original DNA supercoiled form was found to change to relaxed and linear forms, indicating single or double strand breaks. The study demonstrated that the ion bombardment with energy as low as several-tens eV was possible to break DNA strands and thus potential to cause genetic modification of biological cells.

An ion beam deceleration lens for ultra-low-energy ion bombardment of naked DNA

International Nuclear Information System (INIS)

Thopan, P.; Prakrajang, K.; Thongkumkoon, P.; Suwannakachorn, D.; Yu, L.D.

2013-01-01

Highlights: ► An ion beam deceleration lens was designed and constructed. ► The deceleration lens was installed and tested. ► The decelerated ion beam energy was measured using an electrical field. ► Decelerated ultra-low-energy ion beam bombarded naked DNA. ► Ion beam with energy of a few tens of eV could break DNA strands. -- Abstract: Study of low-energy ion bombardment effect on biological living materials is of significance. High-energy ion beam irradiation of biological materials such as organs and cells has no doubt biological effects. However, ion energy deposition in the ion-bombarded materials dominantly occurs in the low-energy range. To investigate effects from very-low-energy ion bombardment on biological materials, an ion beam deceleration lens is necessary for uniform ion energy lower than keV. A deceleration lens was designed and constructed based on study of the beam optics using the SIMION program. The lens consisted of six electrodes, able to focus and decelerate primary ion beam, with the last one being a long tube to obtain a parallel uniform exiting beam. The deceleration lens was installed to our 30-kV bioengineering-specialized ion beam line. The final decelerated-ion energy was measured using a simple electrostatic field to bend the beam to range from 10 eV to 1 keV controlled by the lens parameters and the primary beam condition. In a preliminary test, nitrogen ion beam at 60 eV decelerated from a primary 20-keV beam bombarded naked plasmid DNA. The original DNA supercoiled form was found to change to relaxed and linear forms, indicating single or double strand breaks. The study demonstrated that the ion bombardment with energy as low as several-tens eV was possible to break DNA strands and thus potential to cause genetic modification of biological cells

Intense ion beams for inertial confinement fusion

International Nuclear Information System (INIS)

Mehlhorn, T.A.

1997-01-01

Intense beams of light of heavy ions are being studied as inertial confinement fusion (ICF) drivers for high yield and energy. Heavy and light ions have common interests in beam transport, targets, and alternative accelerators. Self-pinched transport is being jointly studied. This article reviews the development of intense ion beams for ICF. Light-ion drivers are highlighted because they are compact, modular, efficient and low cost. Issues facing light ions are: (1) decreasing beam divergence; (2) increasing beam brightness; and (3) demonstrating self-pinched transport. Applied-B ion diodes are favored because of efficiency, beam brightness, perceived scalability, achievable focal intensity, and multistage capability. A light-ion concept addressing these issues uses: (1) an injector divergence of ≤ 24 mrad at 9 MeV; (2) two-stage acceleration to reduce divergence to ≤ 12 mrad at 35 MeV; and (3) self-pinched transport accepting divergences up to 12 mrad. Substantial progress in ion-driven target physics and repetitive ion diode technology is also presented. Z-pinch drivers are being pursued as the shortest pulsed power path to target physics experiments and high-yield fusion. However, light ions remain the pulsed power ICF driver of choice for high-yield fusion energy applications that require driver standoff and repetitive operation. 100 refs

Evaluation of Negative-Ion-Beam Driver Concepts for Heavy Ion Fusion

International Nuclear Information System (INIS)

Grisham, Larry R.

2002-01-01

We evaluate the feasibility of producing and using atomically neutral heavy ion beams produced from negative ions as drivers for an inertial confinement fusion reactor. Bromine and iodine appear to be the most attractive elements for the driver beams. Fluorine and chlorine appear to be the most appropriate feedstocks for initial tests of extractable negative ion current densities. With regards to ion sources, photodetachment neutralizers, and vacuum requirements for accelerators and beam transport, this approach appears feasible within existing technology, and the vacuum requirements are essentially identical to those for positive ion drivers except in the target chamber. The principal constraint is that this approach requires harder vacuums in the target chamber than do space-charge-neutralized positive ion drivers. With realistic (but perhaps pessimistic) estimates of the total ionization cross section, limiting the ionization of a neutral beam to less than 5% while traversing a four -meter path would require a chamber pressure of no more than 5 x 10 -5 torr. Alternatively, even at chamber pressures that are too high to allow propagation of atomically neutral beams, the negative ion approach may still have appeal, since it precludes the possibly serious problem of electron contamination of a positive ion beam during acceleration, drift compression, and focusing

Surface composition of biomedical components by ion beam analysis

International Nuclear Information System (INIS)

Kenny, M.J.; Wielunski, L.S.; Baxter, G.R.

1991-01-01

Materials used for replacement body parts must satisfy a number of requirements such as biocompatibility and mechanical ability to handle the task with regard to strength, wear and durability. When using a CVD coated carbon fibre reinforced carbon ball, the surface must be ion implanted with uniform dose of nitrogen ions in order to make it wear resistant. The mechanism by which the wear resistance is improved is one of radiation damage and the required dose of about 10 16 cm -2 can have a tolerance of about 20%. To implant a spherical surface requires manipulation of the sample within the beam and control system (either computer or manually operated) to enable uniform dose all the way from polar to equatorial regions on the surface. A manipulator has been designed and built for this purpose. In order to establish whether the dose is uniform, nuclear reaction analysis using the reaction 14 N(d,α) 12 C is an ideal method of profiling. By taking measurements at a number of points on the surface, the uniformity of nitrogen dose can be ascertained. It is concluded that both Rutherford Backscattering and Nuclear Reaction Analysis can be used for rapid analysis of surface composition of carbon based materials used for replacement body components. 2 refs., 2 figs

Ion beam studies

International Nuclear Information System (INIS)

Freeman, J.H.; Chivers, D.J.; Gard, G.A.; Temple, W.

1977-04-01

A description of techniques for the production of intense beams of heavy ions is given. A table of recommended operational procedures for most elements is included. The ionisation of boron is considered in some detail because of its particular importance as a dopant for ion implantation. (author)

Ion beam texturing

Science.gov (United States)

Hudson, W. R.

1977-01-01

A microscopic surface texture was created by sputter-etching a surface while simultaneously sputter-depositing a lower sputter yield material onto the surface. A xenon ion-beam source was used to perform the texturing process on samples as large as 3-cm diameter. Textured surfaces have been characterized with SEM photomicrographs for a large number of materials including Cu, Al, Si, Ti, Ni, Fe, stainless steel, Au, and Ag. A number of texturing parameters are studied including the variation of texture with ion-beam powder, surface temperature, and the rate of texture growth with sputter etching time.

Development and application of ion beam diagnostics

International Nuclear Information System (INIS)

Pfister, Jochen

2010-01-01

At GSI - Helmholtz Centre for Heavy Ion Research in Darmstadt/Germany the HITRAP project is in the commissioning phase. This world-wide unique facility consists of a linear decelerator for heavy, highly charged ions including atomic physics precision experiments. During commissioning of the cavities, transverse emittances were measured using the single-shot pepperpot method as well as the multi-gradient method. The extraction emittance of the experimental storage ring (ESR) was determined. Furthermore, the phase space distribution of an decelerated beam at an intermediate energy of 500keV/u was measured behind the IH-structure. New algorithms have been integrated into the analysis of digital images. The longitudinal bunch structure measurements of the ion beam at the entry point into the decelerator and the operation of the Double-drift Buncher is shown. The design, development and the first commissioning of a new single-shot pepperpot emittance meter for very low beam currents and beam energies in the order of some hundred nA is described, making it possible to measure the beam behind the deceleration cavities. In addition, transverse beam dynamics calculations were performed, which supported the hands-on commissioning of the accelerator. It is described how the entire beam line from the ESR to the radio-frequency quadrupole can be optimized using the new routine for transverse effects of the bunching and deceleration, which was successfully integrated into the software COSY Infinity. (orig.)

Multistable wireless micro-actuator based on antagonistic pre-shaped double beams

International Nuclear Information System (INIS)

Liu, X; Lamarque, F; Doré, E; Pouille, P

2015-01-01

This paper presents a monolithic multistable micro-actuator based on antagonistic pre-shaped double beams. The designed micro-actuator is formed by two rows of bistable micro-actuators providing four stable positions. The bistable mechanism for each row is a pair of antagonistic pre-shaped beams. This bistable mechanism has an easier pre-load operation compared to the pre-compressed bistable beams method. Furthermore, it solves the asymmetrical force output problem of parallel pre-shaped bistable double beams. At the same time, the geometrical limit is lower than parallel pre-shaped bistable double beams, which ensures a smaller stroke of the micro-actuator with the same dimensions. The designed micro-actuator is fabricated using laser cutting machine on medium density fiberboard (MDF). The bistability and merits of antagonistic pre-shaped double beams are experimentally validated. Finally, a contactless actuation test is performed using 660 nm wavelength laser heating shape memory alloy (SMA) active elements. (paper)

Multistable wireless micro-actuator based on antagonistic pre-shaped double beams

Science.gov (United States)

Liu, X.; Lamarque, F.; Doré, E.; Pouille, P.

2015-07-01

This paper presents a monolithic multistable micro-actuator based on antagonistic pre-shaped double beams. The designed micro-actuator is formed by two rows of bistable micro-actuators providing four stable positions. The bistable mechanism for each row is a pair of antagonistic pre-shaped beams. This bistable mechanism has an easier pre-load operation compared to the pre-compressed bistable beams method. Furthermore, it solves the asymmetrical force output problem of parallel pre-shaped bistable double beams. At the same time, the geometrical limit is lower than parallel pre-shaped bistable double beams, which ensures a smaller stroke of the micro-actuator with the same dimensions. The designed micro-actuator is fabricated using laser cutting machine on medium density fiberboard (MDF). The bistability and merits of antagonistic pre-shaped double beams are experimentally validated. Finally, a contactless actuation test is performed using 660 nm wavelength laser heating shape memory alloy (SMA) active elements.

Study of chemically synthesized ZnO nano particles under a bio template using radioactive ion beam

CERN Multimedia

This is a project proposal to study nano sized semiconductor ZnO system, useful in biology and medicinal purposes, using radioactive ion beam from ISOLDE. Doping of the nano particles with Cu, Cd and Ga ions (in their variable valancy states) are expected to impart changes in the electrical structure and properties in the said system under study. The morphological changes, chemical environment, micro structure, electrical and optical properties of the nano size particles of ZnO system (developed under a bio template of folic acid) after the interaction with radioactive ion beam will be studied. The provision of perturbed angular correlation (PAC) study with respect to the changes in chemical environment, where ever possible will be attempted.

Distribution of products in polymer materials induced by ion-beam irradiation

Energy Technology Data Exchange (ETDEWEB)

Sugimoto, Masaki; Kudoh, Hisaaki; Sasuga, Tsuneo; Seguchi, Tadao [Japan Atomic Energy Research Inst., Tokyo (Japan); Hama, Yoshimasa; Hamanaka, Ken-ichi; Matsumoto, Hideya

1997-03-01

The depth profile of double bond formed in low density polyethylene (LDPE) sheet by ion beams irradiation was observed by a micro FT-IR spectrometer in order to investigate the linear energy transfer (LET) dependency on radiation effects to polymer materials. The distribution of double bond formation in LDPE by irradiation of light ions as H+ was found to be same with the dose distribution calculated from TRIM code, and the yield was also same with that by gamma-rays irradiation, which means that the LET dependency is very small. However, the distribution of double bond to depth was much different from the calculated depth-dose in heavy ions irradiation as Ar and Kr. Then, the dose evaluation was difficult from the TRIM code calculation for heavy ions. (author)

PIXE and ion beam analysis in forensics

International Nuclear Information System (INIS)

Bailey, Melanie; Warmenhoven, John; Chrislopher, Matt; Kirkby, Karen; Palitsin, Vladimir; Grime, Geoff; Jeynes, Chris; Jones, Brian; Wenn, Roger

2013-01-01

Full text: University of Surrey has, for the past four years, collaborated with police institutions from across Europe and the rest of the world lo scope potential applications of ion beam analysis (IBA) in forensic science. In doing this we have consulted practitioners across a range of forensic disciplines, and critically compared IBA with conventional characterisation techniques to investigate the areas in which IBA can add evidential value. In this talk, the results of this feasibility study will be presented, showing the types of sample for which IBA shows considerable promise. We will show how a combination of PIXE with other IBA techniques (EBS, PIGE, MeV-SIMS) can be used to give unprecedented characterisation of forensic samples and comment on the significance of these results for forensic casework. We will also show cases where IBA not appear to add any significant improvement over conventional techniques. (author)

Ion sources for initial use at the Holifield radioactive ion beam facility

International Nuclear Information System (INIS)

Alton, G.D.

1994-01-01

The Holifield Radioactive Ion Beam Facility (HRIBF) now under construction at the Oak Ridge National Laboratory will use the 25-MV tandem accelerator for the acceleration of radioactive ion beams to energies appropriate for research in nuclear physics; negative ion beams are, therefore, required for injection into the tandem accelerator. Because charge exchange is an efficient means for converting initially positive ion beams to negative ion beams, both positive and negative ion sources are viable options for use at the facility; the choice of the type of ion source will depend on the overall efficiency for generating the radioactive species of interest. A high-temperature version of the CERN-ISOLDE positive ion source has been selected and a modified version of the source designed and fabricated for initial use at the HRIBF because of its low emittance, relatively high ionization efficiencies and species versatility, and because it has been engineered for remote installation, removal and servicing as required for safe handling in a high-radiation-level ISOL facility. Prototype plasma-sputter negative ion sources and negative surfaceionization sources are also under design consideration for generating negative radioactive ion beams from high electron-affinity elements. A brief review of the HRIBF will be presented, followed by a detailed description of the design features, operational characteristics, ionization efficiencies, and beam qualities (emittances) of these sources

Conical pinched electron beam diode for intense ion beam source

International Nuclear Information System (INIS)

Matsukawa, Yoshinobu; Nakagawa, Yoshiro

1982-01-01

For the purpose of improvement of the pinched electron beam diode, the production of an ion beam by a diode with electrodes in a conical shape was studied at low voltage operation (--200 kV). The ion beam is emitted from a small region of the diode apex. The mean ion beam current density near the axis at 12 cm from the diode apex is two or three times that from an usual flat parallel diode with the same dimension and impedance. The brightness and the power brightness at the otigin are 450 MA/cm 2 sr and 0.12 TW/cm 2 sr respectively. (author)

Metal negative ion beam extraction from a radio frequency ion source

Energy Technology Data Exchange (ETDEWEB)

Kanda, S.; Yamada, N.; Kasuya, T.; Romero, C. F. P.; Wada, M.

2015-04-08

A metal ion source of magnetron magnetic field geometry has been designed and operated with a Cu hollow target. Radio frequency power at 13.56 MHz is directly supplied to the hollow target to maintain plasma discharge and induce self-bias to the target for sputtering. The extraction of positive and negative Cu ion beams have been tested. The ion beam current ratio of Cu{sup +} to Ar{sup +} has reached up to 140% when Ar was used as the discharge support gas. Cu{sup −} ion beam was observed at 50 W RF discharge power and at a higher Ar gas pressure in the ion source. Improvement of poor RF power matching and suppression of electron current is indispensable for a stable Cu{sup −} ion beam production from the source.

Fabrication of micro-prominences on PTFE surface using proton beam writing

Energy Technology Data Exchange (ETDEWEB)

Kitamura, Akane, E-mail: ogawa.akane@jaea.go.jp [Department of Advanced Radiation Technology, Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-Machi, Takasaki, Gunma 370-1292 (Japan); Satoh, Takahiro; Koka, Masashi [Department of Advanced Radiation Technology, Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-Machi, Takasaki, Gunma 370-1292 (Japan); Kobayashi, Tomohiro [Advanced Science Institute, RIKEN, 2-1 Hirosawa, Wako-shi, Saitama 350-0198 (Japan); Kamiya, Tomihiro [Department of Advanced Radiation Technology, Takasaki Advanced Radiation Research Institute, Japan Atomic Energy Agency, 1233 Watanuki-Machi, Takasaki, Gunma 370-1292 (Japan)

2013-07-01

Polytetrafluoroethylene (PTFE) is a typical fluoropolymer and it has several desirable technological properties such as electrical insulation, solid lubrication etc. However, the conventional microstructuring methods have not been well applied to PTFE due to its chemical inertness. Some effective micromachining using synchrotron radiation or ion beam irradiation has been reported. In this study, we create micro-prominences by raising the original surface using proton beam writing (PBW) without chemical etching. A conical prominence was formed by spiral drawing from the center with a 3 MeV proton beam. The body was porous, and the bulk PTFE below the prominence changed to fragmented structures. With decreasing writing speed, the prominence became taller but the height peaked. The prominence gradually reduced in size after the speed reached the optimum value. We expect that these porous projections with high aspect ratio will be versatile in medical fields and microelectromechanical systems (MEMS) technology.

Reconstruction of negative hydrogen ion beam properties from beamline diagnostics

Energy Technology Data Exchange (ETDEWEB)

Ruf, Benjamin

2014-09-25

(BES). BES measures the beam divergence and beam power losses from heavy-particle collisions by evaluating the spectrum of the Balmer H{sub α} light of the beam. The light is emitted since beam particles are excited by collisions with the hydrogen background gas. For ITER, BES will be the main beam diagnostic tool for beam quality measurements. The main results are, that first of all, the evaluation of the beam divergence from a BES spectrum was improved with the parametrisation method. Furthermore it turned out that the evaluation of stripping losses and beam inhomogeneity in large negative hydrogen ion sources cannot be performed by backward calculations from a BES spectra, i.e. by the analysis of the spectra. This means forward modeling has to be done, which does also include the simulation of other beam diagnostic tools, like the power density profile measured by the calorimeter. Combining all beam diagnostic tools and reconstructing their outcome with a BBC-NI Advanced simulation, gives the possibility to determine the beam parameters by extracting them from the BBC-NI code protocols. This requires a lot of effort and is not well suited for a routine analysis. For ITER this means that solely a BES system for the determination of the beam parameters (i.e. stripping losses and beam inhomogeneity), as it is presently foreseen, is not sufficient. Several beam diagnostic tools, e.g. the calorimeter which can determine the power density profile of the beam, and a code like BBC-NI are necessary. Additionally for the application of BBC-NI Advanced, a beam optic code is needed, which is able to generate a realistic electric field map in the extraction system. Such an optic code is not available so far.

A quadrupole ion trap as low-energy cluster ion beam source

CERN Document Server

Uchida, N; Kanayama, T

2003-01-01

Kinetic energy distribution of ion beams was measured by a retarding field energy analyzer for a mass-selective cluster ion beam deposition system that uses a quadrupole ion trap as a cluster ion beam source. The results indicated that the system delivers a cluster-ion beam with energy distribution of approx 2 eV, which corresponded well to the calculation results of the trapping potentials in the ion trap. Using this deposition system, mass-selected hydrogenated Si cluster ions Si sub n H sub x sup + were actually deposited on Si(111)-(7x7) surfaces at impact kinetic energy E sub d of 3-30 eV. Observation by using a scanning tunneling microscope (STM) demonstrated that Si sub 6 H sub x sup + cluster ions landed on the surface without decomposition at E sub d =3 eV, while the deposition was destructive at E sub d>=18 eV. (author)

Ion beam inertial fusion

International Nuclear Information System (INIS)

Bangerter, R.O.

1995-01-01

About twenty years ago, A. W. Maschke of Brookhaven National Laboratory and R. L. Martin of Argonne National Laboratory recognized that the accelerators that have been developed for high energy and nuclear physics are, in many ways, ideally suited to the requirements of inertial fusion power production. These accelerators are reliable, they have a long operating life, and they can be efficient. Maschke and Martin noted that they can focus ion beams to small focal spots over distances of many meters and that they can readily operate at the high pulse repetition rates needed for commercial power production. Fusion, however, does impose some important new constraints that are not important for high energy or nuclear physics applications. The most challenging new constraint from a scientific standpoint is the requirement that the accelerator deliver more than 10 14 W of beam power to a small quantity (less than 100 mg) of matter. The most challenging constraint from an engineering standpoint is accelerator cost. Maschke showed theoretically that accelerators could produce adequate work. Heavy-ion fusion is widely recognized to be a promising approach to inertial fusion power production. It provides an excellent opportunity to apply methods and technology developed for basic science to an important societal need. The pulsed-power community has developed a complementary, parallel approach to ion beam fusion known as light-ion fusion. The talk will discuss both heavy-ion and light-ion fusion. It will explain target physics requirements and show how they lead to constraints on the usual accelerator parameters such as kinetic energy, current, and emittance. The talk will discuss experiments that are presently underway, specifically experiments on high-current ion sources and injectors, pulsed-power machines recirculating induction accelerators, and transverse beam combining. The talk will give a brief description of a proposed new accelerator called Elise

Parametric Study of the current limit within a single driver-scale transport beam line of an induction Linac for Heavy Ion Fusion

International Nuclear Information System (INIS)

Prost, Lionel Robert

2007-01-01

The High Current Experiment (HCX) at Lawrence Berkeley National Laboratory is part of the US program that explores heavy-ion beam as the driver option for fusion energy production in an Inertial Fusion Energy (IFE) plant. The HCX is a beam transport experiment at a scale representative of the low-energy end of an induction linear accelerator driver. The primary mission of this experiment is to investigate aperture fill factors acceptable for the transport of space-charge-dominated heavy-ion beams at high intensity (line charge density ∼0.2 (micro)C/m) over long pulse durations (4 (micro)s) in alternating gradient focusing lattices of electrostatic or magnetic quadrupoles. This experiment is testing transport issues resulting from nonlinear space-charge effects and collective modes, beam centroid alignment and steering, envelope matching, image charges and focusing field nonlinearities, halo and, electron and gas cloud effects. We present the results for a coasting 1 MeV K + ion beam transported through ten electrostatic quadrupoles. The measurements cover two different fill factor studies (60% and 80% of the clear aperture radius) for which the transverse phase-space of the beam was characterized in detail, along with beam energy measurements and the first halo measurements. Electrostatic quadrupole transport at high beam fill factor (∼80%) is achieved with acceptable emittance growth and beam loss. We achieved good envelope control, and re-matching may only be needed every ten lattice periods (at 80% fill factor) in a longer lattice of similar design. We also show that understanding and controlling the time dependence of the envelope parameters is critical to achieving high fill factors, notably because of the injector and matching section dynamics

Ion assistance effects on electron beam deposited MgF sub 2 films

CERN Document Server

Alvisi, M; Della Patria, A; Di Giulio, M; Masetti, E; Perrone, M R; Protopapa, M L; Tepore, A

2002-01-01

Thin films of MgF sub 2 have been deposited by the ion-assisted electron-beam evaporation technique in order to find out the ion beam parameters leading to films of high laser damage threshold whose optical properties are stable under uncontrolled atmosphere conditions. It has been found that the ion-assisted electron-beam evaporation technique allows getting films with optical properties (refraction index and extinction coefficient) of high environmental stability by properly choosing the ion-source voltage and current. But, the laser damage fluence at 308 nm was quite dependent on the assisting ion beam parameters. Larger laser damage fluences have been found for the films deposited by using assisting ion beams delivered at lower anode voltage and current values. It has also been found that the films deposited without ion assistance were characterized by the highest laser damage fluence (5.9 J/cm sup 2) and the lowest environmental stability. The scanning electron microscopy analysis of the irradiated areas...

Beam-front dynamics and ion acceleration in drifting intense relativistic electron beams

International Nuclear Information System (INIS)

Alexander, K.F.; Hintze, W.

1976-01-01

Collective ion acceleration at the injection of a relativistic electron beam into a low-pressure gas or a plasma is discussed and its strong dependence on the beam-front dynamics is shown. A simple one-dimensional model taking explicitly into account the motion and ionizing action of the ions in the beam-front region is developed for the calculation of the beam drift velocity. The obtained pressure dependence is in good agreement with experimental data. The energy distribution is shown of the ions accelerated in the moving potential well of the space charge region. Scaling laws for the beam-front dynamics and ion acceleration are derived. (J.U.)

Ion beam analysis of Cu(In,Ga)Se{sub 2} thin film solar cells

Energy Technology Data Exchange (ETDEWEB)

Karydas, A.G. [International Atomic Energy Agency (IAEA), IAEA Laboratories, Nuclear Science and Instrumentation Laboratory, A-2444 Seibersdorf (Austria); Institute of Nuclear and Particle Physics, NCSR “Demokritos”, 153 10 Aghia Paraskevi, Athens Greece (Greece); Streeck, C. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany); Radovic, I. Bogdanovic [Ruđer Bošković Institute (RBI), Zagreb (Croatia); Kaufmann, C.; Rissom, T. [Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Hahn-Meitner-Platz 1, 14109 Berlin (Germany); Beckhoff, B. [Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin (Germany); Jaksic, M. [Ruđer Bošković Institute (RBI), Zagreb (Croatia); Barradas, N.P. [Centro de Ciências e Tecnologias Nucleares, Instituto Superior Técnico, Universidade de Lisboa, E. N. 10, Apartado 21, 2686-953 Sacavém (Portugal)

2015-11-30

Graphical abstract: - Highlights: • Elemental depth profiles for various CIGS thin films were quantitatively determined. • Pure absorbers, complete cell and bilayer solar cells were prepared and analyzed. • Synergistic PIXE and RBS analysis of thin solar cells using alpha beam particles. • High energy alpha beam resolved completely the Indium depth profile. • Synchrotron based Reference Free GIXRF quantitative analysis validated IBA results. - Abstract: The present work investigates the potential of ion beam analysis (IBA) techniques such as the Rutherford backscattering spectrometry (RBS) and particle induced X-ray emission (PIXE) using helium ions to provide quantitative in-depth elemental analysis of various types of Cu(In,Ga)Se{sub 2} thin films. These films with a thickness of about 2 μm are used as absorber layers in photovoltaic devices with continuously increasing the performance of this technology. The preparation process generally aims to obtain an in-depth gradient of In and Ga concentrations that optimizes the optoelectronic and electrical properties of the solar cell. The measurements were performed at directly accessible single or double layered CIGS absorbers and at buried absorbers in completed thin film solar cells. The IBA data were analyzed simultaneously in order to derive best fitted profiles that match all experimental RBS and PIXE spectra. For some samples elemental profiles deduced form synchrotron based, reference free grazing incidence X-ray fluorescence analysis were compared with the IBA results and an overall good agreement was observed within quoted uncertainties.

Investigation of acoustic waves generated in an elastic solid by a pulsed ion beam and their application in a FIB based scanning ion acoustic microscope

International Nuclear Information System (INIS)

Akhmadaliev, C.

2004-12-01

The aim of this work is to investigate the acoustic wave generation by pulsed and periodically modulated ion beams in different solid materials depending on the beam parameters and to demonstrate the possibility to apply an intensity modulated focused ion beam (FIB) for acoustic emission and for nondestructive investigation of the internal structure of materials on a microscopic scale. The combination of a FIB and an ultrasound microscope in one device can provide the opportunity of nondestructive investigation, production and modification of micro- and nanostructures simultaneously. This work consists of the two main experimental parts. In the first part the process of elastic wave generation during the irradiation of metallic samples by a pulsed beam of energetic ions was investigated in an energy range from 1.5 to 10 MeV and pulse durations of 0.5-5 μs, applying ions with different masses, e.g. oxygen, silicon and gold, in charge states from 1 + to 4 + . The acoustic amplitude dependence on the ion beam parameters like the ion mass and energy, the ion charge state, the beam spot size and the pulse duration were of interest. This work deals with ultrasound transmitted in a solid, i.e. bulk waves, because of their importance for acoustic transmission microscopy and nondestructive inspection of internal structure of a sample. The second part of this work was carried out using the IMSA-100 FIB system operating in an energy range from 30 to 70 keV. The scanning ion acoustic microscope based on this FIB system was developed and tested. (orig.)

Investigation of acoustic waves generated in an elastic solid by a pulsed ion beam and their application in a FIB based scanning ion acoustic microscope

Energy Technology Data Exchange (ETDEWEB)

Akhmadaliev, C.

2004-12-01

The aim of this work is to investigate the acoustic wave generation by pulsed and periodically modulated ion beams in different solid materials depending on the beam parameters and to demonstrate the possibility to apply an intensity modulated focused ion beam (FIB) for acoustic emission and for nondestructive investigation of the internal structure of materials on a microscopic scale. The combination of a FIB and an ultrasound microscope in one device can provide the opportunity of nondestructive investigation, production and modification of micro- and nanostructures simultaneously. This work consists of the two main experimental parts. In the first part the process of elastic wave generation during the irradiation of metallic samples by a pulsed beam of energetic ions was investigated in an energy range from 1.5 to 10 MeV and pulse durations of 0.5-5 {mu}s, applying ions with different masses, e.g. oxygen, silicon and gold, in charge states from 1{sup +} to 4{sup +}. The acoustic amplitude dependence on the ion beam parameters like the ion mass and energy, the ion charge state, the beam spot size and the pulse duration were of interest. This work deals with ultrasound transmitted in a solid, i.e. bulk waves, because of their importance for acoustic transmission microscopy and nondestructive inspection of internal structure of a sample. The second part of this work was carried out using the IMSA-100 FIB system operating in an energy range from 30 to 70 keV. The scanning ion acoustic microscope based on this FIB system was developed and tested. (orig.)

Focused ion beam-fabricated Au micro/nanostructures used as a surface enhanced Raman scattering-active substrate for trace detection of molecules and influenza virus

Energy Technology Data Exchange (ETDEWEB)

Lin, Ying-Yi; Liao, Jiunn-Der; Ju, Yu-Hung; Chang, Chia-Wei [Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan (China); Shiau, Ai-Li, E-mail: jdliao@mail.ncku.edu.tw [Department of Microbiology and Immunology, National Cheng Kung University, No 1, University Road, Tainan 70101, Taiwan (China)

2011-05-06

The focused ion beam (FIB) technique was used to precisely fabricate patterned Au micro/nanostructures (fibAu). The effects of surface enhanced Raman scattering (SERS) on the fibAu samples were investigated by adjusting the geometrical, dimensional, and spacing factors. The SERS mechanism was evaluated using low-concentration rhodamine 6G (R6G) molecules, physically adsorbed or suspended on/within the micro/nanostructures. The results indicated that for detecting R6G molecules, hexagon-like micro/nanostructures induced a higher electromagnetic mechanism (EM) due to the availability of multiple edges and small curvature. By decreasing the dimensions from 300 to 150 nm, the laser-focused area contained an increasing number of micro/nanostructures and therefore intensified the excitation of SERS signals. Moreover, with an optimized geometry and dimensions of the micro/nanostructures, the relative intensity/surface area value reached a maximum as the spacing was 22 nm. An exponential decrease was found as the spacing was increased, which most probably resulted from the loss of EM. The spacing between the micro/nanostructures upon the fibAu was consequently regarded as the dominant factor for the detection of R6G molecules. By taking an optimized fibAu to detect low-concentration influenza virus, the amino acids from the outermost surface of the virus can be well distinguished through the SERS mechanism.

Multicharged and intense heavy ion beam sources

International Nuclear Information System (INIS)

Kutner, V.B.

1981-01-01

The cyclotron plasma-are source (PIG), duoplasmatron (DP), laser source (LS), electron beam ion source (EBIS) and electron cyclotron resonance source (ECRS) from the viewpoint of generating intense and high charge state beams are considered. It is pointed out that for the last years three types of multicharged ion sources-EBIS, ECR and LS have been essentially developed. In the EBIS source the Xe 48+ ions are produced. The present day level of the development of the electron-beam ionization technique shows that by means of this technique intensive uranium nuclei beams production becomes a reality. On the ECR source Xe 26+ approximately 4x10 10 h/s, Asub(r)sup(12+) approximately 10 12 h/s intensive ion beams are produced. In the laser source a full number of C 6+ ions during one laser pulse constitutes not less than 10 10 from the 5x10mm 2 emission slit. At the present time important results are obtained pointing to the possibility to separate the ion component of laser plasma in the cyclotron central region. On the PIG source the Xe 15+ ion current up to 10μA per pulse is produced. In the duoplasmatron the 11-charge state of xenon ion beams is reached [ru

Progress in mass- and energy- analysis of ion beams emitted from RPI and PF-type discharges

International Nuclear Information System (INIS)

Czaus, K.; Skladnik-Sadowska, E.; Kwiatkowski, R.; Malinowski, K.; Zebrowski, J.; Sadowski, M.J.

2013-01-01

The paper describes progress in studies of ion beams generated and accelerated within RPI (Rod Plasma Injector) and PF (Plasma-Focus) devices. To perform mass- and energy-analysis of such ion beams the use was made of different mass-spectrometers of the Thomson type. Ion measurements in RPI-IBIS facility were first performed with a big Thomson analyzer placed outside the vacuum chamber. To perform ion measurements near the electrodes two other Thomson analyzers were constructed at IPJ (now NCBJ). A smaller analyzer was applied in a large PF-1000 facility at IFPiLM, and time-integrated ion parabolas were recorded on nuclear track detectors. That analyzer was also adopted for time-resolved measurements by means of miniature scintillation detectors located along the deuteron parabola and it was used in the RPI-IBIS facility. Recently the analyzer construction was modernized to ensure differential pumping of the inlet system, and it was used for measurements within PF-360 and RPI-IBIS facilities.

Development of small scale mechanical testing techniques on ion beam irradiated 304 SS

International Nuclear Information System (INIS)

Reichardt, A.; Abad, M.D.; Hosemann, P.; Lupinacci, A.; Kacher, J.; Minor, A.; Jiao, Z; Chou, P.

2015-01-01

Austenitic stainless steels are widely used for structural components in light water reactors, however uncertainty in their susceptibility to irradiation assisted stress corrosion cracking (IASCC) has made long term performance predictions difficult. In addition, the testing of reactor irradiated materials has proven challenging due to the long irradiation times required, limited sample availability, and unwanted activation. To address these problems, we apply recently developed techniques in nano-indentation and micro-compression testing to small volume samples of 10 dpa proton-beam irradiated 304 stainless steel. Cross sectional nano-indentation was performed on both proton beam irradiated and non-irradiated samples at temperatures ranging from 22 to 300 C. degrees to determine the effects of irradiation and operating temperature on hardening. Micro-compression tests using 2 μm x 2 μm x 5 μm focused-ion beam milled pillars were then performed in situ in an electron microscope to allow for a more accurate look at stress-strain behavior along with real-time observations of localized mechanical deformation. Large sudden slip events and significant increase in yield strength are observed in irradiated micro-compression samples at room temperature. Elevated temperature nano-indentation results reveal the possibility of thermally-activated changes in deformation mechanism for irradiated specimens. Since the deformation mechanism information provided by micro-compression testing can provide valuable information about IASCC susceptibility, future work will involve ex situ micro-compression tests at reactor operating temperature

Surface modification of poly(tetrafluoroethylene) films by low energy Ar+ ion-beam activation and UV-induced graft copolymerization

International Nuclear Information System (INIS)

Zhang Yan; Huan, A.C.H.; Tan, K.L.; Kang, E.T.

2000-01-01

Surface modification of poly(tetrafluoroethylene) (PTFE) films by Ar + ion-beam irradiation with varying ion energy and ion dose was carried out. The changes in surface composition of the irradiated PTFE films were characterized, both in situ and after exposure to air, by X-ray photoelectron spectroscopy (XPS). The possible mechanisms of chemical reaction induced by the incident ion beam on the surface of PTFE film included defluorination, chain scission and cross-linking, as indicated by the presence of the characteristic peak components associated with the - - -CF 3 , - - -CF, and C(CF 2 ) 4 species in the C 1s core-level spectra, the decrease in surface [F]/[C] ratio, and the increase in surface micro-hardness of the Ar + ion-beam-treated PTFE films. Furthermore, the free radicals generated by the ion-beam could react with oxygen in the air to give rise to oxidized carbon species, such as the peroxides, on the PTFE surface. Thus, after exposure to air, the Ar + ion-beam-pretreated PTFE films were susceptible to further surface modification by UV-induced graft copolymerization with a vinyl monomer, such as acrylamide (AAm). The graft concentrations were deduced from the XPS-derived surface stoichiometries. The Ar + ion energy and the ion dose affected not only the surface composition of the treated films but also the graft copolymerization efficiency of the corresponding pretreated films

Auroral ion beams and ion acoustic wave generation by fan instability

Energy Technology Data Exchange (ETDEWEB)

Vaivads, A

1996-04-01

Satellite observations indicate that efficient energy transport among various plasma particles and between plasma waves and plasma particles is taking place in auroral ion beam regions. These observations show that two characteristic wave types are associated with the auroral ion beam regions: electrostatic hydrogen cyclotron waves with frequencies above hydrogen gyrofrequency, and low frequency waves with frequencies below hydrogen gyrofrequency. We speculate that the low frequency waves can be ion acoustic waves generated through the fan instability. The presence of a cold background ion component is necessary for the onset of this instability. A cold ion component has been directly observed and has been indirectly suggested from observations of solitary wave structures. The wave-particle interaction during the development of the fan instability results in an efficient ion beam heating in the direction perpendicular to the ambient magnetic field. The fan instability development and the ion beam heating is demonstrated in a numerical particle simulation. 23 refs, 16 figs.

Intense ion beam research at Los Alamos

International Nuclear Information System (INIS)

Rej, D.J.; Bartsch, R.R.; Davis, H.A.; Faehl, R.J.; Gautier, D.C.; Greenly, J.B.; Henins, I.; Linton, T.W.; Muenchausen, R.E.; Waganaar, W.J.

1992-01-01

Two new interdisciplinary programs are underway at Los Alamos involving the physics and technology of intense light ion beams. In contrast to high-power ICF applications, the LANL effort concentrates on the development of relatively low-voltage (50 to 800 kV) and long-pulsewidth (0.1 to 1 μs) beams. The first program involves the 1.2 MV, 300-kJ Anaconda generator which has been fitted with an extraction ion diode. Long pulsewidth ion beams have been accelerated, propagated, and extracted for a variety of magnetic field conditions. The primary application of this beam is the synthesis of novel materials. Initial experiments on the congruent evaporative deposition of metallic and ceramic thin films are reported. The second program involves the development of a 120-keV, 50-kA, 1-μs proton beam for the magnetic fusion program as an ion source for an intense diagnostic neutral beam. Ultra-bright, pulsed neutral beams will be required to successfully measure ion temperatures and thermalized alpha particle energy distributions in large, dense, ignited tokamaks such as ITER

Intense ion beam research at Los Alamos

International Nuclear Information System (INIS)

Rej, D.J.; Bartsch, R.R.; Davis, H.A.; Faehl, R.J.; Gautier, D.C.; Greenly, J.B.; Henins, I.; Linton, T.W.; Muenchausen, R.E.; Waganaar, W.J.

1993-01-01

Two new interdisciplinary programs are underway at Los Alamos involving the physics and technology of intense light ion beams. In contrast to high-power ICF applications, the LANL effort concentrates on the development of relatively low-voltage (50 to 800 kV) and long pulsewidth (0.1 to 1 μs) beams. The first program involves the 1.2 MV, 300-kJ Anaconda generator which has been fitted with an extraction ion diode. Long pulsewidth ion beams have been accelerated, propagated, and extracted for a variety of magnetic field conditions. The primary application of this beam is the synthesis of novel materials. Initial experiments on the congruent evaporative deposition of metallic and ceramic thin films are reported. The second program involves the development of a 120-keV, 50-kA, 1-μs proton beam for the magnetic fusion program as an ion source for an intense diagnostic neutral beam. Ultra-bright, pulsed neutral beams will be required to successfully measure ion temperatures and thermalized alpha particle distributions in large, dense, ignited tokamaks such as ITER

Development of ion/proton beam equipment for industrial uses

Energy Technology Data Exchange (ETDEWEB)

Choi, Byung Ho; Lee, J. H.; Cho, Y. S.; Joo, P. K.; Kang, S. S.; Song, W. S.; Kim, H. J.; Chang, G. H.; Bang, S. W

1999-12-01

KAERI has possessed design and fabrication technologies of various ion sources including Duoplasmatron and DuoPiGatron developed by R and D projects of the long-term nuclear technology development program. In order to industrialize ion beam equipments utilizing these ion sources, a technology transfer project for a technology transfer project for a domestic firm has been performed. Under this project, engineers of the firm have been trained through classroom lectures of ion beam principles and OJT, an ion/proton beam equipment (DEMO equipment) has been designed, assembled and commissioned jointly with the engineers. Quality of the ion sources has been quantified, and technologies for ion beam equipment construction, functional test and application research have been developed. The DEMO equipment, which consists of an ion source, power supplies, vacuum, cooling and target systems, has been fabricated and tested to secure stability and reliability for industrial uses. Various characteristic tests including high voltage insulation, beam extraction, beam current measuring, etc. have been performed. This DEMO can be utilized for ion sources development as well as ion beam process development for various industrial products. Engineers of the firm have been trained for the industrialization of ion beam equipment and joined in beam application technology development to create industrial needs of beam equipment. (author)

Temperature-dependent ion beam mixing

International Nuclear Information System (INIS)

Rehn, L.E.; Alexander, D.E.

1993-08-01

Recent work on enhanced interdiffusion rates during ion-beam mixing at elevated temperatures is reviewed. As discussed previously, expected increase in ion-beam mixing rates due to 'radiation-enhanced diffusion' (RED), i.e. the free migration of isolated vacancy and interstitial defects, is well documented in single-crystal specimens in the range of 0.4 to 0.6 of absolute melting temperature. In contrast, the increase often observed at somewhat lower temperatures during ion-beam mixing of polycrystalline specimens is not well understood. However, sufficient evidence is available to show that this increase reflects intracascade enhancement of a thermally-activated process that also occurs without irradiation. Recent evidence is presented which suggests that this process is Diffusion-induced Grain-Boundary Migration (DIGM). An important complementary conclusion is that because ion-beam mixing in single-crystal specimens exhibits no significant temperature dependence below that of RED, models that invoke only irradiation-specific phenomena, e.g., cascade-overlap, thermal-spikes, or liquid-diffusion, and hence which predict no difference in mixing behavior between single- or poly-crystalline specimens, cannot account for the existing results

Ion and laser beam induced metastable alloy formation

International Nuclear Information System (INIS)

Westendorp, J.F.M.

1986-01-01

This thesis deals with ion and laser beam induced thin film mixing. It describes the development of an Ultra High Vacuum apparatus for deposition, ion irradiation and in situ analysis of thin film sandwiches. This chamber has been developed in close collaboration with High Voltage Engineering Europa. Thin films can be deposited by an e-gun evaporator. The atom flux is monitored by a quadrupole mass spectrometer. A comparison is made between ion beam and laser mixing of Cu with Au and Cu with W. The comparison provides a better understanding of the relative importance of purely collisional mixing, the role of thermodynamic effects and the contribution of diffusion due to defect generation and migration. (Auth.)

Ion beam analysis in art and archaeology: attacking the power precisions paradigm

International Nuclear Information System (INIS)

Abraham, Meg

2004-01-01

It is a post-modern axiom that the closer one looks at something the more blinkered is the view, thus the result is often a failure to see the whole picture. With this in mind, the value of a tool for art and archaeology applications is greatly enhanced if the information is scientifically precise and yet is easily integrated into the broader study regarding the objects at hand. Art and archaeological objects offer some unique challenges for researchers. First, they are almost always extraordinarily inhomogeneous across individual pieces and across types. Second they are often valuable and delicate so sampling is discouraged. Finally, in most cases, each piece is unique, thus the data is also unique and is of greatest value when incorporated into the overall understanding of the object or of the culture of the artisan. Ion beam analysis solves many of these problems. With IBA, it is possible to avoid sampling by using an external beam setup or by manipulating small objects in a vacuum. The technique is largely non-destructive, allowing for multiple data points to be taken across an object. The X-ray yields are from deeper in the sample than those of other techniques and using RBS one can attain bulk concentrations from microns into the sample. And finally, the resulting X-ray spectra is easily interpreted and understood by many conservators and curators, while PIXE maps are a wonderful visual record of the results of the analysis. Some examples of the special role that ion beam analysis plays in the examination of cultural objects will be covered in this talk

Cobalt alloy ion sources for focused ion beam implantation

Energy Technology Data Exchange (ETDEWEB)

Muehle, R.; Doebeli, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Zimmermann, P. [Eidgenoessische Technische Hochschule, Zurich (Switzerland)

1997-09-01

Cobalt alloy ion sources have been developed for silicide formation by focused ion beam implantation. Four eutectic alloys AuCo, CoGe, CoY and AuCoGe were produced by electron beam welding. The AuCo liquid alloy ion source was investigated in detail. We have measured the emission current stability, the current-voltage characteristics, and the mass spectrum as a function of the mission current. (author) 1 fig., 2 refs.

Consequences of trapped beam ions of the analysis of neutron emission data

International Nuclear Information System (INIS)

Loughlin, M.J.; Hone, M.; Jarvis, O.N.; Laundy, B.; Sadler, G.; Belle, P. van

1989-01-01

Neutron energy spectra have been measured during D o neutral beam heating of deuterium plasmas. The thermonuclear to beam-plasma neutron production ratios are deduced. For a non-radial spectrometer line-of-sight, the trapped beam-ion fraction must be considered. (author) 5 refs., 4 figs

Ion sources development at GANIL for radioactive beams and high charge state ions

International Nuclear Information System (INIS)

Leroy, R.; Barue, C.; Canet, C.; Dupuis, M.; Flambard, J.L.; Gaubert, G.; Gibouin, S.; Huguet, Y.; Jardin, P.; Lecesne, N.; Leherissier, P.; Lemagnen, F.; Pacquet, J.Y.; Pellemoine-Landre, F.; Rataud, J.P.; Saint-Laurent, M.G.; Villari, A.C.C.; Maunoury, L.

2001-01-01

The GANIL laboratory has in charge the production of ion beams for nuclear and non nuclear physics. This article reviews the last developments that are underway in the fields of radioactive ion beam production, increase of the metallic ion intensities and production of highly charges ion beams. (authors)

Application of electron beam, ion beam and positron beam to polymer sciences

International Nuclear Information System (INIS)

Tagawa, Seiichi

1999-01-01

Full text: Particle beams are finding increasing application in material sciences and the interest covers both applied as well as fundamental investigations. In the present talk application of electron and ion beams in several polymers such as polysilanes, polystyrene, polyolefins, polymethylmethacrylates and related polymers will be presented. It includes among other investigations (such as product analysis) pulse radiolysis studies and effect of LET on polymers. Importance of positron studies in material sciences especially bulk polymers is well documented. A relatively new technique, namely, positron beam application especially in thin film polymers is a new and emerging areas. The interest ranges from applied aspects as well as fundamental understanding of surfaces and interfaces. The present talk will detail the development of a pulsed positron beam using LINAC at Institute of Scientific and Industrial Research (ISIR) as well as its applications to polymer thin films

Beam emittance measurements on multicusp ion sources

Energy Technology Data Exchange (ETDEWEB)

Sarstedt, M.; Lee, Y.; Leung, K.N. [and others

1995-08-01

Multicusp ion sources are used for various applications. Presently, the implementation of this type of ion source planned for the development of an ion beam lithography machine, which will be used for the projection of sub-0.2 {mu}m patterns onto a wafer substrate. Since, for this application, a very good beam quality and a small ion energy spread are required, emittance measurements have been performed on a multicusp ion source for various source conditions. It is shown that the installation of proper capacitors between the extraction electrodes is necessary to avoid rf-pickup, which otherwise leads to a distortion of the beam emittance. The influence of the magnetic filter field on the beam emittance has been investigated, and the beam emittance of a dc filament-discharge plasma has also been compared to that of an rf-generated plasma.

Beam emittance measurements on multicusp ion sources

International Nuclear Information System (INIS)

Sarstedt, M.; Lee, Y.; Leung, K.N.

1995-08-01

Multicusp ion sources are used for various applications. Presently, the implementation of this type of ion source planned for the development of an ion beam lithography machine, which will be used for the projection of sub-0.2 μm patterns onto a wafer substrate. Since, for this application, a very good beam quality and a small ion energy spread are required, emittance measurements have been performed on a multicusp ion source for various source conditions. It is shown that the installation of proper capacitors between the extraction electrodes is necessary to avoid rf-pickup, which otherwise leads to a distortion of the beam emittance. The influence of the magnetic filter field on the beam emittance has been investigated, and the beam emittance of a dc filament-discharge plasma has also been compared to that of an rf-generated plasma

Colliding-beams polarized ion source

International Nuclear Information System (INIS)

Trainor, T.A.; Douglas, J.G.; Badt, D.; Christiensen, C.; Herron, A.; Leach, D.; Olsen, J.; Osborne, J.L.; Zeps, V.

1985-01-01

This ion source was to be purchased from ANAC, Inc., a New Zealand-based supplier of beam optics hardware and atomic beam polarized ion sources in December 1982. Shortly before scheduled delivery ANAC went into receivership. During 1983 little work was done on the project as various steps were taken by us, first to get the ion source completed at ANAC, and then, failing that, to obtain the existing parts. In early 1984 we began work to finish the ion source in Seattle. The project is nearly complete, and this article presents progress to date. 2 refs