Quantum metrology

International Nuclear Information System (INIS)

Xiang Guo-Yong; Guo Guang-Can

2013-01-01

The statistical error is ineluctable in any measurement. Quantum techniques, especially with the development of quantum information, can help us squeeze the statistical error and enhance the precision of measurement. In a quantum system, there are some quantum parameters, such as the quantum state, quantum operator, and quantum dimension, which have no classical counterparts. So quantum metrology deals with not only the traditional parameters, but also the quantum parameters. Quantum metrology includes two important parts: measuring the physical parameters with a precision beating the classical physics limit and measuring the quantum parameters precisely. In this review, we will introduce how quantum characters (e.g., squeezed state and quantum entanglement) yield a higher precision, what the research areas are scientists most interesting in, and what the development status of quantum metrology and its perspectives are. (topical review - quantum information)

In-cell overlay metrology by using optical metrology tool

Science.gov (United States)

Lee, Honggoo; Han, Sangjun; Hong, Minhyung; Kim, Seungyoung; Lee, Jieun; Lee, DongYoung; Oh, Eungryong; Choi, Ahlin; Park, Hyowon; Liang, Waley; Choi, DongSub; Kim, Nakyoon; Lee, Jeongpyo; Pandev, Stilian; Jeon, Sanghuck; Robinson, John C.

2018-03-01

Overlay is one of the most critical process control steps of semiconductor manufacturing technology. A typical advanced scheme includes an overlay feedback loop based on after litho optical imaging overlay metrology on scribeline targets. The after litho control loop typically involves high frequency sampling: every lot or nearly every lot. An after etch overlay metrology step is often included, at a lower sampling frequency, in order to characterize and compensate for bias. The after etch metrology step often involves CD-SEM metrology, in this case in-cell and ondevice. This work explores an alternative approach using spectroscopic ellipsometry (SE) metrology and a machine learning analysis technique. Advanced 1x nm DRAM wafers were prepared, including both nominal (POR) wafers with mean overlay offsets, as well as DOE wafers with intentional across wafer overlay modulation. After litho metrology was measured using optical imaging metrology, as well as after etch metrology using both SE and CD-SEM for comparison. We investigate 2 types of machine learning techniques with SE data: model-less and model-based, showing excellent performance for after etch in-cell on-device overlay metrology.

Metrology for γ-radiation spectrometry in a radiation monitoring system

International Nuclear Information System (INIS)

Khaikovich, I.M.; Shevrygin, O.N.; Fominykh, V.I.

1993-01-01

The rapid measurement of the characteristics of radionuclides is a priority when utilizing nuclear energy because of the needs of environmental conservation. This is particularly the case for long-lived nuclear-fuel fission products, 137,137 Cs, 144 Ce, 60 Co, etc., which as a rule are sources of high-energy γ-radiation. These can be measured by γ-ray spectrometry using scintillation or semiconductor devices. When choosing the metrological models, the starting points are the real characteristics of the distribution of the radionuclides in the soil (rock) and the need to estimate their surface activity and the reserves per unit area, i.e., the parameters from which one can estimate the influence of the radioactivity on nature and can decide the use of land areas. The methodology and the calculations presented show that a single metrological system for radiation monitoring can be constructed using multichannel geophysical radiometers (gamma spectrometers) while relying on a system of initial standard samples of small size. Such a metrological system at present provides all the necessary initial means for measuring the effective γ-radiation surface activity of 137,134 Cs and the mass fraction of the natural radioactive elements. Using these initial means of measurement, surveyed areas in the Leningrad and Tula provinces have been certified as State standard samples in terms of the eight parameters: the surface contamination activity of 137,134 Cs, the reserves of these per unit area, the mass fraction of the natural radioactive elements (potassium, uranium and thorium), the power of the equivalent (exposed) γ-radiation dose at a height of 1 m above the surface. It is intended to use the certified metrological surveyed areas to provide traceability and the required measurement accuracy when studying the contamination in European territories resulting from the accident at the Chernobyl nuclear power station

Final report on SIM.T-S2: Comparison of the calibration of 100 Ω platinum resistance thermometers

Science.gov (United States)

del Campo, D.; Chimenti Ruiz, V.; Méndez-Lango, E.; Córdova, L.; von Borries, E.; Sánchez, C. A.; Arévalo, A.; Aguilera, B.; Guillén, E.; Cabrera, C.; Quintana, L.

2013-01-01

An International Comparison on industrial platinum resistance thermometers (PRTs) among the National Metrology Institutes (NMIs) of Spain, Mexico and the Andean Countries (Bolivia, Colombia, Ecuador, Peru and Venezuela) began in 2004 and was successfully completed in 2005. Two PRTs were circulated (hand-carried) and compared from -40 °C up to 250 °C. The Centro Español de Metrología (Spanish NMI), CEM, was the pilot laboratory and the Centro Nacional de Metrología (Mexican NMI), CENAM, was the co-pilot laboratory. This report presents the results of this comparison and provides detailed information of the measurements performed by the participating laboratories. Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/. The final report has been peer-reviewed and approved for publication by SIM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

An alternative method to achieve metrological confirmation in measurement process

Science.gov (United States)

Villeta, M.; Rubio, E. M.; Sanz, A.; Sevilla, L.

2012-04-01

Metrological confirmation process must be designed and implemented to ensure that metrological characteristics of the measurement system meet metrological requirements of the measurement process. The aim of this paper is to present an alternative method to the traditional metrological requirements about the relationship between tolerance and measurement uncertainty, to develop such confirmation processes. The proposed way to metrological confirmation considers a given inspection task of the measurement process into the manufacturing system, and it is based on the Index of Contamination of the Capability, ICC. Metrological confirmation process is then developed taking into account the producer risks and economic considerations on this index. As a consequence, depending on the capability of the manufacturing process, the measurement system will be or will not be in adequate state of metrological confirmation for the measurement process.

A Laser Metrology/Viewing System for ITER In-Vessel Inspection

International Nuclear Information System (INIS)

Spampinato, P.T.; Barry, R.E.; Chesser, J.B.; Menon, M.M.; Dagher, M.A.; Slotwinski, A.

1997-10-01

This paper identifies the requirements for a remotely operated precision laser ranging system for the International Thermonuclear Experimental Reactor. The inspection system is used for metrology and viewing, and must be capable of achieving submillimeter accuracy and operation in a reactor vessel that has high gamma radiation, high vacuum, elevated temperature, and magnetic field levels. A coherent, frequency modulated laser radar system is under development to meet these requirements. The metrology/viewing sensor consists of a compact laser-optic module linked through fiberoptics to the laser source and imaging units, located outside the harsh environment. The deployment mechanism is a remotely operated telescopic mast. Gamma irradiation up to 10 7 Gy was conducted on critical sensor components with no significant impact to data transmission, and analysis indicates that critical sensor components can operate in a magnetic field with certain design modifications. Plans for testing key components in a magnetic field are underway

Metrological characteristics of the new BSS2 beta secondary standard system

International Nuclear Information System (INIS)

Reynaldo, Sibele R.

2005-01-01

Due to the increased interest and the importance of beta radiation dosimetry for radiation protection purposes, the Centro de Desenvolvimento da Tecnologia Nuclear. MG, Brazil, acquired the newest Beta Secondary Standard system (BSS2) in order to replace the old BSS1 model, with the goal of implement a beta radiation metrology laboratory and provide the corresponding reference radiation. The new system BSS2, unique in Latin America, requires operational testing and metrological characterization for reliability purposes. For this, some comparative investigations of the two systems were made. The influence of opening and closing the shutter in the final dose of radiation was identified as the highest in the BSS2 in relation to the one founded in BSS1, justified by the structural difference of the shutters of the systems and the reproducibility of source-detector geometry was better in BSS2, because of the robustness of the same

Realizing "value-added" metrology

Science.gov (United States)

Bunday, Benjamin; Lipscomb, Pete; Allgair, John; Patel, Dilip; Caldwell, Mark; Solecky, Eric; Archie, Chas; Morningstar, Jennifer; Rice, Bryan J.; Singh, Bhanwar; Cain, Jason; Emami, Iraj; Banke, Bill, Jr.; Herrera, Alfredo; Ukraintsev, Vladamir; Schlessinger, Jerry; Ritchison, Jeff

2007-03-01

The conventional premise that metrology is a "non-value-added necessary evil" is a misleading and dangerous assertion, which must be viewed as obsolete thinking. Many metrology applications are key enablers to traditionally labeled "value-added" processing steps in lithography and etch, such that they can be considered integral parts of the processes. Various key trends in modern, state-of-the-art processing such as optical proximity correction (OPC), design for manufacturability (DFM), and advanced process control (APC) are based, at their hearts, on the assumption of fine-tuned metrology, in terms of uncertainty and accuracy. These trends are vehicles where metrology thus has large opportunities to create value through the engineering of tight and targetable process distributions. Such distributions make possible predictability in speed-sorts and in other parameters, which results in high-end product. Additionally, significant reliance has also been placed on defect metrology to predict, improve, and reduce yield variability. The necessary quality metrology is strongly influenced by not only the choice of equipment, but also the quality application of these tools in a production environment. The ultimate value added by metrology is a result of quality tools run by a quality metrology team using quality practices. This paper will explore the relationships among present and future trends and challenges in metrology, including equipment, key applications, and metrology deployment in the manufacturing flow. Of key importance are metrology personnel, with their expertise, practices, and metrics in achieving and maintaining the required level of metrology performance, including where precision, matching, and accuracy fit into these considerations. The value of metrology will be demonstrated to have shifted to "key enabler of large revenues," debunking the out-of-date premise that metrology is "non-value-added." Examples used will be from critical dimension (CD

SIMS applications workshop. Proceedings

Energy Technology Data Exchange (ETDEWEB)

NONE

1997-04-01

The first ANSTO/AINSE SIMS Workshop drew together a mixture of Surface Analysis experts and Surface Analysis users with the concept that SIMS analysis has to be enfolded within the spectrum of surface analysis techniques and that the user should select the technique most applicable to the problem. With this concept in mind the program was structured as sessions on SIMS Facilities; Applications to Mineral Surfaces; Applications to Biological Systems, Applications to Surfaces as Semi- conductors, Catalysts and Surface Coatings; and Applications to Ceramics

Distributed large-scale dimensional metrology new insights

CERN Document Server

Franceschini, Fiorenzo; Maisano, Domenico

2011-01-01

Focuses on the latest insights into and challenges of distributed large scale dimensional metrology Enables practitioners to study distributed large scale dimensional metrology independently Includes specific examples of the development of new system prototypes

Automation of metrological operations on measuring apparatuses of radiation monitoring system

International Nuclear Information System (INIS)

Kulich, V.; Studeny, J.

1995-01-01

(J.K.)In this paper the measuring apparatuses of ionizing radiation for the radiation monitoring of NPP Dukovany operation is described. The increase of metrological operations number has been made possible only by a timely reconstruction of the laboratory and by computerization of the measuring procedure and of administrative work which consists mainly of recording of a great number information pieces about the observed measuring apparatuses. There are three working places in the laboratory: 1) irradiation gamma stand with cesium-137 sources; 2) irradiation stand with plutonium-beryllium neutron sources; 3) spectrometric working place. With the regard to the uniqueness of the laboratory operation, all the works in the sphere of hardware as well as software has been implemented by own forces. The equipment of the laboratory makes possible to test metrologically all the radiation monitoring apparatuses used in NPP Dukovany. The quantity of operation of he laboratory of ionizing metrology qualifies the proper functioning of the radiation monitoring system, which directly influences the ensurance of nuclear safety of NPP Dukovany

Automation of metrological operations on measuring apparatuses of radiation monitoring system

Energy Technology Data Exchange (ETDEWEB)

Kulich, V; Studeny, J [NPP Dukovany (Czech Republic)

1996-12-31

(J.K.)In this paper the measuring apparatuses of ionizing radiation for the radiation monitoring of NPP Dukovany operation is described. The increase of metrological operations number has been made possible only by a timely reconstruction of the laboratory and by computerization of the measuring procedure and of administrative work which consists mainly of recording of a great number information pieces about the observed measuring apparatuses. There are three working places in the laboratory: 1) irradiation gamma stand with cesium-137 sources; 2) irradiation stand with plutonium-beryllium neutron sources; 3) spectrometric working place. With the regard to the uniqueness of the laboratory operation, all the works in the sphere of hardware as well as software has been implemented by own forces. The equipment of the laboratory makes possible to test metrologically all the radiation monitoring apparatuses used in NPP Dukovany. The quantity of operation of he laboratory of ionizing metrology qualifies the proper functioning of the radiation monitoring system, which directly influences the ensurance of nuclear safety of NPP Dukovany.

A holistic approach to SIM platform and its application to early-warning satellite system

Science.gov (United States)

Sun, Fuyu; Zhou, Jianping; Xu, Zheyao

2018-01-01

This study proposes a new simulation platform named Simulation Integrated Management (SIM) for the analysis of parallel and distributed systems. The platform eases the process of designing and testing both applications and architectures. The main characteristics of SIM are flexibility, scalability, and expandability. To improve the efficiency of project development, new models of early-warning satellite system were designed based on the SIM platform. Finally, through a series of experiments, the correctness of SIM platform and the aforementioned early-warning satellite models was validated, and the systematical analyses for the orbital determination precision of the ballistic missile during its entire flight process were presented, as well as the deviation of the launch/landing point. Furthermore, the causes of deviation and prevention methods will be fully explained. The simulation platform and the models will lay the foundations for further validations of autonomy technology in space attack-defense architecture research.

Virtual overlay metrology for fault detection supported with integrated metrology and machine learning

Science.gov (United States)

Lee, Hong-Goo; Schmitt-Weaver, Emil; Kim, Min-Suk; Han, Sang-Jun; Kim, Myoung-Soo; Kwon, Won-Taik; Park, Sung-Ki; Ryan, Kevin; Theeuwes, Thomas; Sun, Kyu-Tae; Lim, Young-Wan; Slotboom, Daan; Kubis, Michael; Staecker, Jens

2015-03-01

While semiconductor manufacturing moves toward the 7nm node for logic and 15nm node for memory, an increased emphasis has been placed on reducing the influence known contributors have toward the on product overlay budget. With a machine learning technique known as function approximation, we use a neural network to gain insight to how known contributors, such as those collected with scanner metrology, influence the on product overlay budget. The result is a sufficiently trained function that can approximate overlay for all wafers exposed with the lithography system. As a real world application, inline metrology can be used to measure overlay for a few wafers while using the trained function to approximate overlay vector maps for the entire lot of wafers. With the approximated overlay vector maps for all wafers coming off the track, a process engineer can redirect wafers or lots with overlay signatures outside the standard population to offline metrology for excursion validation. With this added flexibility, engineers will be given more opportunities to catch wafers that need to be reworked, resulting in improved yield. The quality of the derived corrections from measured overlay metrology feedback can be improved using the approximated overlay to trigger, which wafers should or shouldn't be, measured inline. As a development or integration engineer the approximated overlay can be used to gain insight into lots and wafers used for design of experiments (DOE) troubleshooting. In this paper we will present the results of a case study that follows the machine learning function approximation approach to data analysis, with production overlay measured on an inline metrology system at SK hynix.

Optical metrology for advanced process control: full module metrology solutions

Science.gov (United States)

Bozdog, Cornel; Turovets, Igor

2016-03-01

Optical metrology is the workhorse metrology in manufacturing and key enabler to patterning process control. Recent advances in device architecture are gradually shifting the need for process control from the lithography module to other patterning processes (etch, trim, clean, LER/LWR treatments, etc..). Complex multi-patterning integration solutions, where the final pattern is the result of multiple process steps require a step-by-step holistic process control and a uniformly accurate holistic metrology solution for pattern transfer for the entire module. For effective process control, more process "knobs" are needed, and a tighter integration of metrology with process architecture.

Introduction to quantum metrology quantum standards and instrumentation

CERN Document Server

Nawrocki, Waldemar

2015-01-01

This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called  Quantum SI, is introduced. This book helps to understand and approve the new system to both technology a...

The quality of measurements a metrological reference

CERN Document Server

Fridman, A E

2012-01-01

This book provides a detailed discussion and commentary on the fundamentals of metrology. The fundamentals of metrology, the principles underlying the design of the SI International System of units, the theory of measurement error, a new methodology for estimation of measurement accuracy based on uncertainty, and methods for reduction of measured results and estimation of measurement uncertainty are all discussed from a modern point of view. The concept of uncertainty is shown to be consistent with the classical theory of accuracy. The theory of random measurement errors is supplemented by a very general description based on the generalized normal distribution; systematic instrumental error is described in terms of a methodology for normalizing the metrological characteristics of measuring instruments. A new international system for assuring uniformity of measurements based on agreements between national metrological institutes is discussed, in addition to the role and procedure for performance of key compari...

Consultative committee on ionizing radiation: Impact on radionuclide metrology

International Nuclear Information System (INIS)

Karam, L.R.; Ratel, G.

2016-01-01

In response to the CIPM MRA, and to improve radioactivity measurements in the face of advancing technologies, the CIPM's consultative committee on ionizing radiation developed a strategic approach to the realization and validation of measurement traceability for radionuclide metrology. As a consequence, measurement institutions throughout the world have devoted no small effort to establish radionuclide metrology capabilities, supported by active quality management systems and validated through prioritized participation in international comparisons, providing a varied stakeholder community with measurement confidence. - Highlights: • Influence of CIPM MRA on radionuclide metrology at laboratories around the world. • CCRI strategy: to be the “undisputed hub for ionizing radiation global metrology.” • CCRI Strategic Plan stresses importance of measurement confidence for stakeholder. • NMIs increasing role in radionuclide metrology by designating institutions (DIs). • NMIs and DIs establish quality systems; validate capabilities through comparisons.

Laser metrology for a next generation gravimetric mission

Science.gov (United States)

Mottini, Sergio; Biondetti, Giorgio; Cesare, Stefano; Castorina, Giuseppe; Musso, Fabio; Pisani, Marco; Leone, Bruno

2017-11-01

Within the ESA technology research project "Laser Interferometer High Precision tracking for LEO", Thales Alenia Space Italia is developing a laser metrology system for a Next Generation Gravimetric Mission (NGGM) based on satellite-to-satellite tracking. This technique is based on the precise measurement of the displacement between two satellites flying in formation at low altitude for monitoring the variations of Earth's gravity field at high resolution over a long time period. The laser metrology system that has been defined for this mission consists of the following elements: • an heterodyne Michelson interferometer for measuring the distance variation between retroreflectors positioned on the two satellites; • an angle metrology for measuring the orientation of the laser beam in the reference frames of the two satellites; • a lateral displacement metrology for measuring the deviations of the laser beam axis from the target retro-reflector. The laser interferometer makes use of a chopped measurement beam to avoid spurious signals and nonlinearity caused by the unbalance between the strong local beam and the weak return beam. The main results of the design, development and test activities performed on the breadboard of the metrology system are summarized in this paper.

Emerging technology for astronomical optics metrology

Science.gov (United States)

Trumper, Isaac; Jannuzi, Buell T.; Kim, Dae Wook

2018-05-01

Next generation astronomical optics will enable science discoveries across all fields and impact the way we perceive the Universe in which we live. To build these systems, optical metrology tools have been developed that push the boundary of what is possible. We present a summary of a few key metrology technologies that we believe are critical for the coming generation of optical surfaces.

LISA Pathfinder: Optical Metrology System monitoring during operations

Science.gov (United States)

Audley, Heather E.; LISA Pathfinder Collaboration

2017-05-01

The LISA Pathfinder (LPF) mission has demonstrated excellent performance. In addition to having surpassed the main mission goals, data has been collected from the various subsystems throughout the duration of the mission. This data is a valuable resource, both for a more complete understanding of the LPF satellite and the differential acceleration measurements, as well as for the design of the future Laser Interferometer Space Antenna (LISA) mission. Initial analysis of the Optical Metrology System (OMS) data was performed as part of daily system monitoring, and more in-depth analyses are ongoing. This contribution presents an overview of these activities along with an introduction to the OMS.

The Parallel System for Integrating Impact Models and Sectors (pSIMS)

Science.gov (United States)

Elliott, Joshua; Kelly, David; Chryssanthacopoulos, James; Glotter, Michael; Jhunjhnuwala, Kanika; Best, Neil; Wilde, Michael; Foster, Ian

2014-01-01

We present a framework for massively parallel climate impact simulations: the parallel System for Integrating Impact Models and Sectors (pSIMS). This framework comprises a) tools for ingesting and converting large amounts of data to a versatile datatype based on a common geospatial grid; b) tools for translating this datatype into custom formats for site-based models; c) a scalable parallel framework for performing large ensemble simulations, using any one of a number of different impacts models, on clusters, supercomputers, distributed grids, or clouds; d) tools and data standards for reformatting outputs to common datatypes for analysis and visualization; and e) methodologies for aggregating these datatypes to arbitrary spatial scales such as administrative and environmental demarcations. By automating many time-consuming and error-prone aspects of large-scale climate impacts studies, pSIMS accelerates computational research, encourages model intercomparison, and enhances reproducibility of simulation results. We present the pSIMS design and use example assessments to demonstrate its multi-model, multi-scale, and multi-sector versatility.

Understanding IEC standard wind turbine models using SimPowerSystems

DEFF Research Database (Denmark)

Das, Kaushik; Hansen, Anca Daniela; Sørensen, Poul Ejnar

2016-01-01

This article describes and exemplifies the IEC 61400-27 generic wind turbine models through an interactive multimedia learning environment - Matlab SimPowerSystems. The article aims help engineers with different backgrounds to get a better understanding of wind turbine dynamics and control...

Development and application of a Chinese webpage suicide information mining system (sims).

Science.gov (United States)

Chen, Penglai; Chai, Jing; Zhang, Lu; Wang, Debin

2014-11-01

This study aims at designing and piloting a convenient Chinese webpage suicide information mining system (SIMS) to help search and filter required data from the internet and discover potential features and trends of suicide. SIMS utilizes Microsoft Visual Studio2008, SQL2008 and C# as development tools. It collects webpage data via popular search engines; cleans the data using trained models plus minimum manual help; translates the cleaned texts into quantitative data through models and supervised fuzzy recognition; analyzes and visualizes related variables by self-programmed algorithms. The SIMS developed comprises such functions as suicide news and blogs collection, data filtering, cleaning, extraction and translation, data analysis and presentation. SIMS-mediated mining of one-year webpage revealed that: peak months and hours of web-reported suicide events were June-July and 10-11 am respectively, and the lowest months and hours, September-October and 1-7 am; suicide reports came mostly from Soho, Tecent, Sina etc.; male suicide victims over counted female victims in most sub-regions but southwest China; homes, public places and rented houses were the top three places to commit suicide; poisoning, cutting vein and jumping from building were the most commonly used methods to commit suicide; love disputes, family disputes and mental diseases were the leading causes. SIMS provides a preliminary and supplementary means for monitoring and understanding suicide. It proposes useful aspects as well as tools for analyzing the features and trends of suicide using data derived from Chinese webpages. Yet given the intrinsic "dual nature" of internet-based suicide information and the tremendous difficulties experienced by ourselves and other researchers, there is still a long way to go for us to expand, refine and evaluate the system.

Nanoelectronics: Metrology and Computation

International Nuclear Information System (INIS)

Lundstrom, Mark; Clark, Jason V.; Klimeck, Gerhard; Raman, Arvind

2007-01-01

Research in nanoelectronics poses new challenges for metrology, but advances in theory, simulation and computing and networking technology provide new opportunities to couple simulation and metrology. This paper begins with a brief overview of current work in computational nanoelectronics. Three examples of how computation can assist metrology will then be discussed. The paper concludes with a discussion of how cyberinfrastructure can help connect computing and metrology using the nanoHUB (www.nanoHUB.org) as a specific example

Metrology Measurement Capabilities

Energy Technology Data Exchange (ETDEWEB)

Dr. Glen E. Gronniger

2007-10-02

This document contains descriptions of Federal Manufacturing & Technologies (FM&T) Metrology capabilities, traceability flow charts, and the measurement uncertainty of each measurement capability. Metrology provides NIST traceable precision measurements or equipment calibration for a wide variety of parameters, ranges, and state-of-the-art uncertainties. Metrology laboratories conform to the requirements of the Department of Energy Development and Production Manual Chapter 13.2, ANSI/ISO/IEC ANSI/ISO/IEC 17025:2005, and ANSI/NCSL Z540-1. FM&T Metrology laboratories are accredited by NVLAP for the parameters, ranges, and uncertainties listed in the specific scope of accreditation under NVLAP Lab code 200108-0. See the Internet at http://ts.nist.gov/Standards/scopes/2001080.pdf. These parameters are summarized. The Honeywell Federal Manufacturing & Technologies (FM&T) Metrology Department has developed measurement technology and calibration capability in four major fields of measurement: (1) Mechanical; (2) Environmental, Gas, Liquid; (3) Electrical (DC, AC, RF/Microwave); and (4) Optical and Radiation. Metrology Engineering provides the expertise to develop measurement capabilities for virtually any type of measurement in the fields listed above. A strong audit function has been developed to provide a means to evaluate the calibration programs of our suppliers and internal calibration organizations. Evaluation includes measurement audits and technical surveys.

Temperature metrology

Science.gov (United States)

Fischer, J.; Fellmuth, B.

2005-05-01

The majority of the processes used by the manufacturing industry depend upon the accurate measurement and control of temperature. Thermal metrology is also a key factor affecting the efficiency and environmental impact of many high-energy industrial processes, the development of innovative products and the health and safety of the general population. Applications range from the processing, storage and shipment of perishable foodstuffs and biological materials to the development of more efficient and less environmentally polluting combustion processes for steel-making. Accurate measurement and control of temperature is, for instance, also important in areas such as the characterization of new materials used in the automotive, aerospace and semiconductor industries. This paper reviews the current status of temperature metrology. It starts with the determination of thermodynamic temperatures required on principle because temperature is an intensive quantity. Methods to determine thermodynamic temperatures are reviewed in detail to introduce the underlying physical basis. As these methods cannot usually be applied for practical measurements the need for a practical temperature scale for day-to-day work is motivated. The International Temperature Scale of 1990 and the Provisional Low Temperature Scale PLTS-2000 are described as important parts of the International System of Units to support science and technology. Its main importance becomes obvious in connection with industrial development and international markets. Every country is strongly interested in unique measures, in order to guarantee quality, reproducibility and functionability of products. The eventual realization of an international system, however, is only possible within the well-functioning organization of metrological laboratories. In developed countries the government established scientific institutes have certain metrological duties, as, for instance, the maintenance and dissemination of national

Temperature metrology

International Nuclear Information System (INIS)

Fischer, J; Fellmuth, B

2005-01-01

The majority of the processes used by the manufacturing industry depend upon the accurate measurement and control of temperature. Thermal metrology is also a key factor affecting the efficiency and environmental impact of many high-energy industrial processes, the development of innovative products and the health and safety of the general population. Applications range from the processing, storage and shipment of perishable foodstuffs and biological materials to the development of more efficient and less environmentally polluting combustion processes for steel-making. Accurate measurement and control of temperature is, for instance, also important in areas such as the characterization of new materials used in the automotive, aerospace and semiconductor industries. This paper reviews the current status of temperature metrology. It starts with the determination of thermodynamic temperatures required on principle because temperature is an intensive quantity. Methods to determine thermodynamic temperatures are reviewed in detail to introduce the underlying physical basis. As these methods cannot usually be applied for practical measurements the need for a practical temperature scale for day-to-day work is motivated. The International Temperature Scale of 1990 and the Provisional Low Temperature Scale PLTS-2000 are described as important parts of the International System of Units to support science and technology. Its main importance becomes obvious in connection with industrial development and international markets. Every country is strongly interested in unique measures, in order to guarantee quality, reproducibility and functionability of products. The eventual realization of an international system, however, is only possible within the well-functioning organization of metrological laboratories. In developed countries the government established scientific institutes have certain metrological duties, as, for instance, the maintenance and dissemination of national

An AFM-SIMS Nano Tomography Acquisition System

Science.gov (United States)

Swinford, Richard William

An instrument, adding the capability to measure 3D volumetric chemical composition, has been constructed by me as a member of the Sanchez Nano Laboratory. The laboratory's in situ atomic force microscope (AFM) and secondary ion mass spectrometry systems (SIMS) are functional and integrated as one instrument. The SIMS utilizes a Ga focused ion beam (FIB) combined with a quadrupole mass analyzer. The AFM is comprised of a 6-axis stage, three coarse axes and three fine. The coarse stage is used for placing the AFM tip anywhere inside a (13x13x5 mm3) (xyz) volume. Thus the tip can be moved in and out of the FIB processing region with ease. The planned range for the Z-axis piezo was 60 microm, but was reduced after it was damaged from arc events. The repaired Z-axis piezo is now operated at a smaller nominal range of 18 microm (16.7 microm after pre-loading), still quite respectable for an AFM. The noise floor of the AFM is approximately 0.4 nm Rq. The voxel size for the combined instrument is targeted at 50 nm or larger. Thus 0.4 nm of xyz uncertainty is acceptable. The instrument has been used for analyzing samples using FIB beam currents of 250 pA and 5.75 nA. Coarse tip approaches can take a long time so an abbreviated technique is employed. Because of the relatively long thro of the Z piezo, the tip can be disengaged by deactivating the servo PID. Once disengaged, it can be moved laterally out of the way of the FIB-SIMS using the coarse stage. This instrument has been used to acquire volumetric data on AlTiC using AFM tip diameters of 18.9 nm and 30.6 nm. Acquisition times are very long, requiring multiple days to acquire a 50-image stack. New features to be added include auto stigmation, auto beam shift, more software automation, etc. Longer term upgrades to include a new lower voltage Z-piezo with strain-gauge feedback and a new design to extend the life for the coarse XY nano-positioners. This AFM-SIMS instrument, as constructed, has proven to be a great proof

ImagingSIMS

Energy Technology Data Exchange (ETDEWEB)

2017-11-06

ImagingSIMS is an open source application for loading, processing, manipulating and visualizing secondary ion mass spectrometry (SIMS) data. At PNNL, a separate branch has been further developed to incorporate application specific features for dynamic SIMS data sets. These include loading CAMECA IMS-1280, NanoSIMS and modified IMS-4f raw data, creating isotopic ratio images and stitching together images from adjacent interrogation regions. In addition to other modifications of the parent open source version, this version is equipped with a point-by-point image registration tool to assist with streamlining the image fusion process.

Capability Handbook- offline metrology

DEFF Research Database (Denmark)

Islam, Aminul; Marhöfer, David Maximilian; Tosello, Guido

This offline metrological capability handbook has been made in relation to HiMicro Task 3.3. The purpose of this document is to assess the metrological capability of the HiMicro partners and to gather the information of all available metrological instruments in the one single document. It provides...

Celtiberian metrology and its romanization

Directory of Open Access Journals (Sweden)

Leonard A. CURCHIN

2013-05-01

Full Text Available Celtiberian metrology has scarcely been investigated until now, with the exception of coin weights. On the basis of measurements of pre-Roman mud bricks, a Celtiberian foot of 24 cm is proposed. With regard to weights, we can accept a module of 9 g for silver jewelry and some bronze coins; however, loom weights do not conform to any metrological system. Over time, Roman measures of length (as indicated by the dimensions of bricks, tiles and architectural monuments and weight were adopted.

Process and system - A dual definition, revisited with consequences in metrology

Science.gov (United States)

Ruhm, K. H.

2010-07-01

Lets assert that metrology life could be easier scientifically as well as technologically, if we, intentionally, would make an explicit distinction between two outstanding domains, namely the given, really existent domain of processes and the just virtually existent domain of systems, the latter of which is designed and used by the human mind. The abstract domain of models, by which we map the manifold reality of processes, is itself part of the domain of systems. Models support comprehension and communication, although they are normally extreme simplifications of properties and behaviour of a concrete reality. So, systems and signals represent processes and quantities, which are described by means of Signal and System Theory as well as by Stochastics and Statistics. The following presentation of this new, demanding and somehow irritating definition of the terms process and system as a dual pair is unusual indeed, but it opens the door widely to a better and more consistent discussion and understanding of manifold scientific tools in many areas. Metrology [4] is one of the important fields of concern due to many reasons: One group of the soft and hard links between the domain of processes and the domain of systems is realised by concepts of measurement science on the one hand and by instrumental tools of measurement technology on the other hand.

Renewable Energy Power System Modular SIMulators: RPM-Sim User's Guide (Supersedes October 1999 edition)

Energy Technology Data Exchange (ETDEWEB)

Bialasiewicz, J.T.; Muljadi, E.; Nix, G.R.; Drouilhet, S.

2001-03-28

This version of the RPM-SIM User's Guide supersedes the October 1999 edition. Using the VisSimTM visual environment, researchers developed a modular simulation system to facilitate an application-specific, low-cost study of the system dynamics for wind-diesel hybrid power systems. This manual presents the principal modules of the simulator and, using case studies of a hybrid system, demonstrates some of the benefits that can be gained from understanding the effects of the designer's modifications to these complex dynamic systems.

Metrological and operational performance of measuring systems used in vehicle compressed natural gas filling stations

Energy Technology Data Exchange (ETDEWEB)

Velosa, Jhonn F.; Abril, Henry; Garcia, Luis E. [CDT de GAS (Venezuela). Gas Technological Development Center Corporation

2008-07-01

Corporation CDT GAS financially supported by the Colombian government through COLCIENCIAS, carried out a study aimed at designing, developing and implementing in Colombia a calibration and metrological verification 'specialized service' for gas meters installed at dispensers of filling stations using compressed natural gas. The results permitted the identification of improving opportunities (in measuring systems, equipment and devices used to deliver natural gas) which are focused on achieving the highest security and reliability of trading processes of CNG for vehicles. In the development of the first stage of the project, metrological type variables were initially considered, but given the importance of the measuring system and its interaction with the various elements involving gas supply to the filling station, the scope of the work done included aspects related to the operational performance, that is, those influencing the security of the users and the metrological performance of the measuring system. The development of the second stage counted on the collaboration of national companies from the sector of CNG for vehicles, which permitted the carrying out of multiple calibrations to the measuring systems installed in the CNG dispensers, thus achieving, in a concrete way, valid and reliable technological information of the implemented procedures. (author)

Development of Pre-Service and In-Service Information Management System (iSIMS)

International Nuclear Information System (INIS)

Yoo, H. J.; Choi, S. N.; Kim, H. N.; Kim, Y. H.; Yang, S. H.

2004-01-01

The iSTMS is a web-based integrated information system supporting Pre-Service and In-Service Inspection(PSI/ISI) processes for the nuclear power plants of KHNP(Korea Hydro and Nuclear Power Co. Ltd.). The system provides a full spectrum coverage of the inspection processes from the planning stage to the final report of examination in accordance with applicable codes, standards, and regulatory requirements. The major functions of the system includes the inspection planning, examination, reporting, project control and status reporting, resource management as well as objects search and navigation. The system also provides two dimensional or three dimensional visualization interface to identify the location and geometry of components and weld areas subject to examination in collaboration with database applications. The iSIMS is implemented with commercial software packages such as database management system, 2-D and 3-D visualization tool, etc., which provide open, updated and verified foundations. This paper describes the key functions and the technologies for the implementation of the iSIMS

Development of Pre-Service and In-Service Information Management System (iSIMS)

Energy Technology Data Exchange (ETDEWEB)

Yoo, H. J.; Choi, S. N.; Kim, H. N.; Kim, Y. H.; Yang, S. H. [Korea Electric Power Research Institute, Daejeon (Korea, Republic of)

2004-08-15

The iSTMS is a web-based integrated information system supporting Pre-Service and In-Service Inspection(PSI/ISI) processes for the nuclear power plants of KHNP(Korea Hydro and Nuclear Power Co. Ltd.). The system provides a full spectrum coverage of the inspection processes from the planning stage to the final report of examination in accordance with applicable codes, standards, and regulatory requirements. The major functions of the system includes the inspection planning, examination, reporting, project control and status reporting, resource management as well as objects search and navigation. The system also provides two dimensional or three dimensional visualization interface to identify the location and geometry of components and weld areas subject to examination in collaboration with database applications. The iSIMS is implemented with commercial software packages such as database management system, 2-D and 3-D visualization tool, etc., which provide open, updated and verified foundations. This paper describes the key functions and the technologies for the implementation of the iSIMS

Reducing measurement uncertainty drives the use of multiple technologies for supporting metrology

Science.gov (United States)

Banke, Bill, Jr.; Archie, Charles N.; Sendelbach, Matthew; Robert, Jim; Slinkman, James A.; Kaszuba, Phil; Kontra, Rick; DeVries, Mick; Solecky, Eric P.

2004-05-01

Perhaps never before in semiconductor microlithography has there been such an interest in the accuracy of measurement. This interest places new demands on our in-line metrology systems as well as the supporting metrology for verification. This also puts a burden on the users and suppliers of new measurement tools, which both challenge and complement existing manufacturing metrology. The metrology community needs to respond to these challenges by using new methods to assess the fab metrologies. An important part of this assessment process is the ability to obtain accepted reference measurements as a way of determining the accuracy and Total Measurement Uncertainty (TMU) of an in-line critical dimension (CD). In this paper, CD can mean any critical dimension including, for example, such measures as feature height or sidewall angle. This paper describes the trade-offs of in-line metrology systems as well as the limitations of Reference Measurement Systems (RMS). Many factors influence each application such as feature shape, material properties, proximity, sampling, and critical dimension. These factors, along with the metrology probe size, interaction volume, and probe type such as e-beam, optical beam, and mechanical probe, are considered. As the size of features shrinks below 100nm some of the stalwarts of reference metrology come into question, such as the electrically determined transistor gate length. The concept of the RMS is expanded to show how multiple metrologies are needed to achieve the right balance of accuracy and sampling. This is also demonstrated for manufacturing metrology. Various comparisons of CDSEM, scatterometry, AFM, cross section SEM, electrically determined CDs, and TEM are shown. An example is given which demonstrates the importance in obtaining TMU by balancing accuracy and precision for selecting manufacturing measurement strategy and optimizing manufacturing metrology. It is also demonstrated how the necessary supporting metrology will

Conceptual design finalisation of the ITER In-Vessel Viewing and Metrology System (IVVS)

Energy Technology Data Exchange (ETDEWEB)

Dubus, Gregory, E-mail: gregory.dubus@f4e.europa.eu [Fusion for Energy, c/ Josep Pla, n°2 - Torres Diagonal Litoral - Edificio B3, 08019 Barcelona (Spain); Puiu, Adrian; Damiani, Carlo; Van Uffelen, Marco; Lo Bue, Alessandro; Izquierdo, Jesus; Semeraro, Luigi [Fusion for Energy, c/ Josep Pla, n°2 - Torres Diagonal Litoral - Edificio B3, 08019 Barcelona (Spain); Martins, Jean-Pierre; Palmer, Jim [ITER Organization, Route de Vinon sur Verdon, 13115 Saint Paul Lez Durance (France)

2013-10-15

The In-Vessel Viewing and Metrology System (IVVS) is a fundamental tool for the ITER machine operations, aiming at performing inspections as well as providing information related to the erosion of in-vessel components. Periodically or on request, the IVVS probes will be deployed into the Vacuum Vessel from their storage positions (still within the ITER primary confinement) in order to perform both viewing and metrology on plasma facing components (blanket, divertor, heating/diagnostic plugs, test blanket modules) and, more generically, to provide information on the status of the in-vessel components. In 2011, the IO proposed to simplify and strengthen the six IVVS port extensions situated at the divertor level. Among other important consequences, such as the relocation of the Glow Discharge Cleaning (GDC) electrodes at other levels of the machine, this major design change implied the need for a substantial redesign of the IVVS plug, which took part to an on-going effort to bring the integrated IVVS concept – including the scanning probe and its deployment system – to the level of maturity suitable for the Conceptual Design Review. This paper gives an overview of the various design and R and D activities in progress: plug design integration, probe concept validation under environmental conditions, development of a metrology strategy, the whole supported by a nuclear analysis.

ToF-SIMS and Laser-SNMS Imaging of Heterogeneous Topographically Complex Polymer Systems.

Science.gov (United States)

Pelster, Andreas; Körsgen, Martin; Kurosawa, Takako; Morita, Hiromi; Arlinghaus, Heinrich F

2016-10-04

Heterogeneous polymer coatings, such as those used in organic electronics and medical devices, are of increasing industrial importance. In order to advance the development of these types of systems, analytical techniques are required which are able to determine the elemental and molecular spatial distributions, on a nanometer scale, with very high detection efficiency and sensitivity. The goal of this study was to investigate the suitability of laser postionization secondary neutral mass spectrometry (Laser-SNMS) with a 157 nm postionization laser beam to image structured polymer mixtures and compare the results with time-of-flight secondary ion mass spectrometry (ToF-SIMS) measurements using Bi 3 + primary ions. The results showed that Laser-SNMS is better suited than ToF-SIMS for unambiguous detection and submicrometer imaging of the wide range of polymers investigated. The data also showed that Laser-SNMS has the advantage of being much more sensitive (in general higher by more than an order of magnitude and peaking at up to 3 orders of magnitude) than ToF-SIMS while also showing superior performance on topographically complex structured insulating surfaces, due to significantly reduced field effects and a higher dynamic range as compared to ToF-SIMS. It is concluded that Laser-SNMS is a powerful complementary technique to ToF-SIMS for the analysis of heterogeneous polymers and other complex structured organic mixtures, providing submicrometer resolution and high sensitivity.

STAT, GAPS, STRAIN, DRWDIM: a system of computer codes for analyzing HTGR fuel test element metrology data. User's manual

Energy Technology Data Exchange (ETDEWEB)

Saurwein, J.J.

1977-08-01

A system of computer codes has been developed to statistically reduce Peach Bottom fuel test element metrology data and to compare the material strains and fuel rod-fuel hole gaps computed from these data with HTGR design code predictions. The codes included in this system are STAT, STRAIN, GAPS, and DRWDIM. STAT statistically evaluates test element metrology data yielding fuel rod, fuel body, and sleeve irradiation-induced strains; fuel rod anisotropy; and additional data characterizing each analyzed fuel element. STRAIN compares test element fuel rod and fuel body irradiation-induced strains computed from metrology data with the corresponding design code predictions. GAPS compares test element fuel rod, fuel hole heat transfer gaps computed from metrology data with the corresponding design code predictions. DRWDIM plots the measured and predicted gaps and strains. Although specifically developed to expedite the analysis of Peach Bottom fuel test elements, this system can be applied, without extensive modification, to the analysis of Fort St. Vrain or other HTGR-type fuel test elements.

Metrology of electrical quantum

International Nuclear Information System (INIS)

Camon, A.

1996-01-01

Since 1989 the electrical metrology laboratory of TPYCEA and the low temperature physics department of ICMA have been collaborating in the development of electrical quantum metrology. ICMA has been mainly dedicated to implement the state of the art quantum standards for which its experience on cryogenics, superconductivity and low noise instrumentation was essential. On the other hand TPYCEA concentrated its efforts on the metrological aspects, in which it has great experience. The complimentary knowledge of both laboratories, as well as the advice obtained from several prestigious metrology institutes was the key to successful completion of the two projects so far developed: i) The Josephson voltage standard (1989-1991) ii) The quantum Hall resistance standard (1991-1996) This report contains a description of both projects. Even though we can consider that the two projects are finished from the instrumental and metrological point of view, there is still a strong cooperation between ICMA and TPYCEA on the improvement of these standards, as well as on their international validation

Integration of mask and silicon metrology in DFM

Science.gov (United States)

Matsuoka, Ryoichi; Mito, Hiroaki; Sugiyama, Akiyuki; Toyoda, Yasutaka

2009-03-01

We have developed a highly integrated method of mask and silicon metrology. The method adopts a metrology management system based on DBM (Design Based Metrology). This is the high accurate contouring created by an edge detection algorithm used in mask CD-SEM and silicon CD-SEM. We have inspected the high accuracy, stability and reproducibility in the experiments of integration. The accuracy is comparable with that of the mask and silicon CD-SEM metrology. In this report, we introduce the experimental results and the application. As shrinkage of design rule for semiconductor device advances, OPC (Optical Proximity Correction) goes aggressively dense in RET (Resolution Enhancement Technology). However, from the view point of DFM (Design for Manufacturability), the cost of data process for advanced MDP (Mask Data Preparation) and mask producing is a problem. Such trade-off between RET and mask producing is a big issue in semiconductor market especially in mask business. Seeing silicon device production process, information sharing is not completely organized between design section and production section. Design data created with OPC and MDP should be linked to process control on production. But design data and process control data are optimized independently. Thus, we provided a solution of DFM: advanced integration of mask metrology and silicon metrology. The system we propose here is composed of followings. 1) Design based recipe creation: Specify patterns on the design data for metrology. This step is fully automated since they are interfaced with hot spot coordinate information detected by various verification methods. 2) Design based image acquisition: Acquire the images of mask and silicon automatically by a recipe based on the pattern design of CD-SEM.It is a robust automated step because a wide range of design data is used for the image acquisition. 3) Contour profiling and GDS data generation: An image profiling process is applied to the acquired image based

New reference object for metrological performance testing of industrial CT systems

DEFF Research Database (Denmark)

Müller, Pavel; Hiller, Jochen; Cantatore, Angela

2012-01-01

This paper presents a new reference object, so called “CT ball plate”, used for metrological performance testing of industrial CT systems, and discusses both the calibration procedure using a tactile coordinate measuring machine and the first results carried out using an industrial CT scanner....... This artefact can be used to determine several characteristics of the CT system like, probing errors of spheres, length measuring errors between sphere centers, measurement errors in the whole CT volume and effects in connection with image artefacts....

CalSimHydro Tool - A Web-based interactive tool for the CalSim 3.0 Hydrology Prepropessor

Science.gov (United States)

Li, P.; Stough, T.; Vu, Q.; Granger, S. L.; Jones, D. J.; Ferreira, I.; Chen, Z.

2011-12-01

used to run CalSim 3.0. The CalSimHydro tool streamlines the complicated steps to configure and run the hydrology preprocessor by providing a user-friendly visual interface and back-end services to validate user inputs and manage the model execution. It is a powerful addition to the new CalSim 3.0 system.

A primary mirror metrology system for the GMT

Science.gov (United States)

Rakich, A.

2016-07-01

The Giant Magellan Telescope (GMT)1 is a 25 m "doubly segmented" telescope composed of seven 8.4 m "unit Gregorian telescopes", on a common mount. Each primary and secondary mirror segment will ideally lie on the geometrical surface of the corresponding rotationally symmetrical full aperture optical element. Therefore, each primary and conjugated secondary mirror segment will feed a common instrument interface, their focal planes co-aligned and cophased. First light with a subset of four unit telescopes is currently scheduled for 2022. The project is currently considering an important aspect of the assembly, integration and verification (AIV) phase of the project. This paper will discuss a dedicated system to directly characterize the on-sky performance of the M1 segments, independently of the M2 subsystem. A Primary Mirror Metrology System (PMS) is proposed. The main purpose of this system will be to he4lp determine the rotation axis of an instrument rotator (the Gregorian Instrument Rotator or GIR in this case) and then to characterize the deflections and deformations of the M1 segments with respect to this axis as a function of gravity and temperature. The metrology system will incorporate a small (180 mm diameter largest element) prime focus corrector (PFC) that simultaneously feeds a risk reduction during AIV; it allows an on-sky characterization of the primary mirror segments and cells, without the complications of other optical elements. The PMS enables a very useful alignment strategy that constrains each primary mirror segments' optical axes to follow the GIR axis to within a few arc seconds. An additional attractive feature of the incorporation of the PMS into the AIV plan, is that it allows first on-sky telescope operations to occur with a system of considerably less optical and control complexity than the final doubly segmented Gregorian telescope configuration. This paper first discusses the strategic rationale for a PMS. Next the system itself is

SimPackJ/S: a web-oriented toolkit for discrete event simulation

Science.gov (United States)

Park, Minho; Fishwick, Paul A.

2002-07-01

SimPackJ/S is the JavaScript and Java version of SimPack, which means SimPackJ/S is a collection of JavaScript and Java libraries and executable programs for computer simulations. The main purpose of creating SimPackJ/S is that we allow existing SimPack users to expand simulation areas and provide future users with a freeware simulation toolkit to simulate and model a system in web environments. One of the goals for this paper is to introduce SimPackJ/S. The other goal is to propose translation rules for converting C to JavaScript and Java. Most parts demonstrate the translation rules with examples. In addition, we discuss a 3D dynamic system model and overview an approach to 3D dynamic systems using SimPackJ/S. We explain an interface between SimPackJ/S and the 3D language--Virtual Reality Modeling Language (VRML). This paper documents how to translate C to JavaScript and Java and how to utilize SimPackJ/S within a 3D web environment.

Management of metrology in measuring of the displacement of building construction

Directory of Open Access Journals (Sweden)

Jiří Kratochvíl

2007-06-01

Full Text Available The metrology management of the measurement of the displacement of building construction is not regulated in the standard ČSN ISO 73 0405 - Measurement of the displacement of building construction. But the metrology management has to be included in the project of measurement of the displacement (Stage of project. Then we have to pay an attention to the metrological management during this measurement (Stage of realization and during the evaluation of this measurement (Stage of evaluation. We have to insist on the subsequent improving of metrology management within the frame of the next project (so-called feedback. The metrology management in the measurement of the displacement during the stages should be based on an application of statutory instruments and technical standards. We should insist especially on the system of standards for the quality control ISO 9000. Considering specialities of geodetic measurements it is necessary to adapt the metrology management. That is why it will differ from the metrology management in other fields of knowledge. This paper includes some steps of metrological provision which must not be ignored.

Analysis of key technologies for virtual instruments metrology

Science.gov (United States)

Liu, Guixiong; Xu, Qingui; Gao, Furong; Guan, Qiuju; Fang, Qiang

2008-12-01

Virtual instruments (VIs) require metrological verification when applied as measuring instruments. Owing to the software-centered architecture, metrological evaluation of VIs includes two aspects: measurement functions and software characteristics. Complexity of software imposes difficulties on metrological testing of VIs. Key approaches and technologies for metrology evaluation of virtual instruments are investigated and analyzed in this paper. The principal issue is evaluation of measurement uncertainty. The nature and regularity of measurement uncertainty caused by software and algorithms can be evaluated by modeling, simulation, analysis, testing and statistics with support of powerful computing capability of PC. Another concern is evaluation of software features like correctness, reliability, stability, security and real-time of VIs. Technologies from software engineering, software testing and computer security domain can be used for these purposes. For example, a variety of black-box testing, white-box testing and modeling approaches can be used to evaluate the reliability of modules, components, applications and the whole VI software. The security of a VI can be assessed by methods like vulnerability scanning and penetration analysis. In order to facilitate metrology institutions to perform metrological verification of VIs efficiently, an automatic metrological tool for the above validation is essential. Based on technologies of numerical simulation, software testing and system benchmarking, a framework for the automatic tool is proposed in this paper. Investigation on implementation of existing automatic tools that perform calculation of measurement uncertainty, software testing and security assessment demonstrates the feasibility of the automatic framework advanced.

Metrological Array of Cyber-Physical Systems. Part 10. Foundations of Objective Qualimetry

Directory of Open Access Journals (Sweden)

Svyatoslav YATSYSHYN

2015-07-01

Full Text Available Contemporary trend of Cyber-Physical Systems evolution considers as promising line the metrology science development ability for estimation the quality of final or intermediate product. The reliability and perfection of smart and flexible operation of mentioned systems could be permanently improved if determination of critical characteristics would be performed correctly, and particular coordinated assessment would be non-correlatively fulfilled. Last is guaranteed at applying thermodynamic principles of coordinates’ choice.

The SimPort-based simulators and distributed control systems development, upgrade and testing

International Nuclear Information System (INIS)

Danilov, Victor A.; Yanushevich, Dmitry I.; Zenkov, Andrey D.

2004-01-01

This paper describes the SimPort computer technology application experience related with power plant simulators and Distributed Control System (DCS) emulators development. The paper presents basic characteristics of the SimPort as a Windows NT-based implementation variety of the developed in RRC 'Kurchatov Institute' math modeling and simulator creation AIS technology. The new approaches and benefits of using simulation for DCS development and, especially upgrade, testing and on plant tuning are presented in the paper briefly. The DCS-inclusive power plant SimPort-based simulators are also considered. The DCS emulation principal problems, solutions and the experience-based DCS emulators development methodology are presented also. The presented technology quality and efficiency as well as presented DCS emulation problem solutions were verified by the smallest power plant full scope computer simulators development man-hours (at least twice lower in comparison with the similar simulators) in combination with the simulators correspondence to the standard and the best quality of nuclear power plant simulators. (Author)

Metrological AFMs and its application for versatile nano-dimensional metrology tasks

Science.gov (United States)

Dai, Gaoliang; Dziomba, T.; Pohlenz, F.; Danzebrink, H.-U.; Koenders, L.

2010-08-01

Traceable calibrations of various micro and nano measurement devices are crucial tasks for ensuring reliable measurements for micro and nanotechnology. Today metrological AFM are widely used for traceable calibrations of nano dimensional standards. In this paper, we introduced the developments of metrological force microscopes at PTB. Of the three metrological AFMs described here, one is capable of measuring in a volume of 25 mm x 25 mm x 5 mm. All instruments feature interferometers and the three-dimensional position measurements are thus directly traceable to the metre definition. Some calibration examples on, for instance, flatness standards, step height standards, one and two dimensional gratings are demonstrated.

SIMS: addressing the problem of heterogeneity in databases

Science.gov (United States)

Arens, Yigal

1997-02-01

The heterogeneity of remotely accessible databases -- with respect to contents, query language, semantics, organization, etc. -- presents serious obstacles to convenient querying. The SIMS (single interface to multiple sources) system addresses this global integration problem. It does so by defining a single language for describing the domain about which information is stored in the databases and using this language as the query language. Each database to which SIMS is to provide access is modeled using this language. The model describes a database's contents, organization, and other relevant features. SIMS uses these models, together with a planning system drawing on techniques from artificial intelligence, to decompose a given user's high-level query into a series of queries against the databases and other data manipulation steps. The retrieval plan is constructed so as to minimize data movement over the network and maximize parallelism to increase execution speed. SIMS can recover from network failures during plan execution by obtaining data from alternate sources, when possible. SIMS has been demonstrated in the domains of medical informatics and logistics, using real databases.

Radionuclide metrology: traceability and response to a radiological accident

Energy Technology Data Exchange (ETDEWEB)

Tauhata, L.; Cruz, P.A.L. da; Silva, C.J. da; Delgado, J.U.; Oliveira, A.E. de; Oliveira, E.M. de; Poledna, R.; Loureiro, J. dos S.; Ferreira Filho, A.L.; Silva, R.L. da; Filho, O. L.T.; Santos, A.R.L. dos; Veras, E.V. de; Rangel, J. de A.; Quadros, A.L.L.; Araújo, M.T.F. de; Souza, P.S. de; Ruzzarim, A.; Conceição, D.A. da; Iwahara, A., E-mail: palcruz@ird.gov.br [Instituto de Radioproteção e Dosimetria (LNMRI/IRD/CNEN-RJ), Rio de Janeiro, RJ (Brazil). Lab. Nacional de Metrologia das Radiações Ionizantes

2017-07-01

In the case of a radiological accident, there are characteristic phases: discovery and initial assistance with first aid; the triage and monitoring of the affected population; the release of the affected people; forward the victims to medical care; as well as the preparation of the report on the accident. In addition, studies and associated researches performed in the later period. Monitors, dosimeters and measuring systems should be calibrated by contaminating radionuclide standards. The radioactive sources used must be metrologically reliable. In Brazil, this function is performed by LNMRI/IRD/CNEN, designated by INMETRO, which Radionuclide Metrology Laboratory is responsible for the standardization and supply of radioactive sources in diverse geometries and matrices. This laboratory has a stock of radionuclide solutions with controlled environmental variables for the preparation of sources, which are calibrated and standardized by mean of primary and secondary systems. It is also responsible for the dissemination of standards and, in order to establish the metrological traceability of national standards, participates in international key-comparisons promoted by BIPM and regional metrology organizations. Internally, it promotes the National Comparison Programs for laboratories for the analysis of environmental samples and the traceability for producing centers of radiopharmaceuticals and Nuclear Medicine Services in the country. The paper presents the demand for {sup 137}Cs related to the radioactive accident in Goiania/Brazil and the significant results for the main radionuclides standardized by the Radionuclide Metrology Laboratory for international key-comparisons and national comparisons to provide metrological traceability. With the obtained results, the LNMRI of Brazil integrates the international metrology BIPM network and fulfills its function of supplying, with about a hundred of radioactive standards, the country's needs in different applications

Radionuclide metrology: traceability and response to a radiological accident

International Nuclear Information System (INIS)

Tauhata, L.; Cruz, P.A.L. da; Silva, C.J. da; Delgado, J.U.; Oliveira, A.E. de; Oliveira, E.M. de; Poledna, R.; Loureiro, J. dos S.; Ferreira Filho, A.L.; Silva, R.L. da; Filho, O. L.T.; Santos, A.R.L. dos; Veras, E.V. de; Rangel, J. de A.; Quadros, A.L.L.; Araújo, M.T.F. de; Souza, P.S. de; Ruzzarim, A.; Conceição, D.A. da; Iwahara, A.

2017-01-01

In the case of a radiological accident, there are characteristic phases: discovery and initial assistance with first aid; the triage and monitoring of the affected population; the release of the affected people; forward the victims to medical care; as well as the preparation of the report on the accident. In addition, studies and associated researches performed in the later period. Monitors, dosimeters and measuring systems should be calibrated by contaminating radionuclide standards. The radioactive sources used must be metrologically reliable. In Brazil, this function is performed by LNMRI/IRD/CNEN, designated by INMETRO, which Radionuclide Metrology Laboratory is responsible for the standardization and supply of radioactive sources in diverse geometries and matrices. This laboratory has a stock of radionuclide solutions with controlled environmental variables for the preparation of sources, which are calibrated and standardized by mean of primary and secondary systems. It is also responsible for the dissemination of standards and, in order to establish the metrological traceability of national standards, participates in international key-comparisons promoted by BIPM and regional metrology organizations. Internally, it promotes the National Comparison Programs for laboratories for the analysis of environmental samples and the traceability for producing centers of radiopharmaceuticals and Nuclear Medicine Services in the country. The paper presents the demand for 137 Cs related to the radioactive accident in Goiania/Brazil and the significant results for the main radionuclides standardized by the Radionuclide Metrology Laboratory for international key-comparisons and national comparisons to provide metrological traceability. With the obtained results, the LNMRI of Brazil integrates the international metrology BIPM network and fulfills its function of supplying, with about a hundred of radioactive standards, the country's needs in different applications

Radiation protection - quality and metrology

International Nuclear Information System (INIS)

Broutin, J.P.

2002-01-01

The radiation protection gathers three occupations: radiation protection agents; environment agents ( control and monitoring); metrology agents ( activities measurement and calibration). The quality and the metrology constitute a contribution in the technique competence and the guarantee of the service quality. This article, after a historical aspect of quality and metrology in France explains the advantages of such a policy. (N.C.)

Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

DEFF Research Database (Denmark)

Takeda, M.; Wang, W.; Hanson, Steen Grüner

2008-01-01

We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because i...

A Roadmap for Thermal Metrology

Science.gov (United States)

Bojkovski, J.; Fischer, J.; Machin, G.; Pavese, F.; Peruzzi, A.; Renaot, E.; Tegeler, E.

2009-02-01

A provisional roadmap for thermal metrology was developed in Spring 2006 as part of the EUROMET iMERA activity toward increasing impact from national investment in European metrology R&D. This consisted of two parts: one addressing the influence of thermal metrology on society, industry, and science, and the other specifying the requirements of enabling thermal metrology to serve future needs. The roadmap represents the shared vision of the EUROMET TC Therm committee as to how thermal metrology should develop to meet future requirements over the next 15 years. It is important to stress that these documents are a first attempt to roadmap the whole of thermal metrology and will certainly need regular review and revision to remain relevant and useful to the community they seek to serve. The first part of the roadmap, “Thermal metrology for society, industry, and science,” identifies the main social and economic triggers driving developments in thermal metrology—notably citizen safety and security, new production technologies, environment and global climate change, energy, and health. Stemming from these triggers, key targets are identified that require improved thermal measurements. The second part of the roadmap, “Enabling thermal metrology to serve future needs” identifies another set of triggers, like global trade and interoperability, future needs in transport, and the earth radiation budget. Stemming from these triggers, key targets are identified, such as improved realizations and dissemination of the SI unit the kelvin, anchoring the kelvin to the Boltzmann constant, k B, and calculating thermal properties from first principles. To facilitate these outcomes, the roadmap identifies the technical advances required in thermal measurement standards.

Joint Research on Scatterometry and AFM Wafer Metrology

Science.gov (United States)

Bodermann, Bernd; Buhr, Egbert; Danzebrink, Hans-Ulrich; Bär, Markus; Scholze, Frank; Krumrey, Michael; Wurm, Matthias; Klapetek, Petr; Hansen, Poul-Erik; Korpelainen, Virpi; van Veghel, Marijn; Yacoot, Andrew; Siitonen, Samuli; El Gawhary, Omar; Burger, Sven; Saastamoinen, Toni

2011-11-01

Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both experimental and modelling methods will be enhanced and different methods will be compared with each other and with specially adapted atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurement systems in measurement comparisons. Additionally novel methods for sophisticated data analysis will be developed and investigated to reach significant reductions of the measurement uncertainties in critical dimension (CD) metrology. One final goal will be the realisation of a wafer based reference standard material for calibration of scatterometers.

System design package for SIMS prototype system 3, solar heating and domestic hot water

Energy Technology Data Exchange (ETDEWEB)

1978-11-01

This report is a collation of documents and drawings that describe a prototype solar heating and hot water system using liquid flat plat collectors and a gas or electric furnace energy subsystem. The system was designed for installation into a single-family dwelling. The description, performance specification, subsystem drawings, verification plan/procedure, and hazard analysis of the system are packaged for evaluation of the system with information sufficient to assemble a similar system. The SIMS Prototype Heating and Hot Water System, Model Number 3 has been installed in a residence at Glendo State Park, Glendo, Wyoming.

Development of an ultrasensitive interferometry system as a key to precision metrology applications

Science.gov (United States)

Gohlke, Martin; Schuldt, Thilo; Weise, Dennis; Johann, Ulrich; Peters, Achim; Braxmaier, Claus

2009-06-01

We present a symmetric heterodyne interferometer as a prototype of a highly sensitive translation and tilt measurement system. This compact optical metrology system was developed over the past several years by EADS Astrium (Friedrichshafen) in cooperation with the Humboldt-University (Berlin) and the university of applied science Konstanz (HTWG-Konstanz). The noise performance was tested at frequencies between 10-4 and 3 Hz, the noise levels are below 1 nm/Hz 1/2 for translation and below 1 μrad/Hz1/2, for tilt measurements. For frequencies higher than 10 mHz noise levels below 5pm/Hz1/2 and 4 nrad/Hz1/2 respectively, were demonstrated. Based on this highly sensitive metrology system we also developed a dilatometer for the characterization of the CTE (coefficient of thermal expansion) of various materials, i.e. CFRP (carbon fiber reinforced plastic) or Zerodur. The currently achieved sensitivity of these measurements is better than 10-7 K-1. Future planned applications of the interferometer include ultra-high-precision surface profiling and characterization of actuator noise in low-noise opto-mechanics setups. We will give an overview of the current experimental setup and the latest measurement results.

Chemical metrology, strategic job for the Chilean Nuclear Energy Commission

International Nuclear Information System (INIS)

Gras, Nuri; Munoz, Luis; Cortes, Eduardo

2001-01-01

The National Standardization Institute's (INN) Metrology unit prepared a study in 1996 to evaluate the impact of metrological activity in Chile. This study was based on a survey of the supply and demand of metrological services and on studies of the behavior of the production system and technological services in Chile during the period 1990-1996. With the information obtained in this study the economic impact resulting from the lack of a national metrology system could be evaluated. This impact was estimated to be a 5% loss in gross national product equal to 125-500 million dollars because of direct product rejection in the mining, fisheries, agricultural and manufacturing sectors. Chemical measurements are responsible for 50% of these losses. In response to this need and coordinated by the INN, a metrological network of reference laboratories began to operate in 1997 for the principal physical magnitudes (mass, temperature, longitude and force) and a CORFO-FDI project began in 2001 that includes the chemical magnitudes. The Chilean Nuclear Energy Commission, aware of the problem's importance and the amount of economic damage that the country may suffer, as a result of these deficiencies, has formed a Chemical Metrology Unit to provide technical support. It aims to raise the standards of local analytical laboratories by providing international recognition to the export sector. Nuclear analytical techniques are used as reference methods. This work describes the laboratories that are included in this Chemical Metrology Unit and the historical contribution to the development of local analytical chemistry. The national and international projects are described together with the publications they have generated. The quality assurance program applied to the laboratories is described as well, which has led to the accreditation of the analytical chemical assays. The procedures used for validation and calculation of uncertain nuclear methodologies are described together with

Normal and Abnormal Scenario Modeling with GoldSim for Radioactive Waste Disposal System

International Nuclear Information System (INIS)

Lee, Youn Myoung; Jeong, Jong Tae

2010-08-01

A modeling study and development of a total system performance assessment (TSPA) template program, by which an assessment of safety and performance for the radioactive waste repository with normal and/or abnormal nuclide release cases could be assessed has been carried out by utilizing a commercial development tool program, GoldSim. Scenarios associated with the various FEPs and involved in the performance of the proposed repository in view of nuclide transport and transfer both in the geosphere and biosphere has been also carried out. Selected normal and abnormal scenarios that could alter groundwater flow scheme and then nuclide transport are modeled with the template program. To this end in-depth system models for the normal and abnormal well and earthquake scenarios that are conceptually and rather practically described and then ready for implementing into a GoldSim TSPA template program are introduced with conceptual schemes for each repository system. Illustrative evaluations with data currently available are also shown

Information system planning work on maintenance metrological equipment

Directory of Open Access Journals (Sweden)

Dmitry V. Shtoller

2011-05-01

Full Text Available Computerization has entered into all human activities. Important role in the work now is a workstation, which increases productivity. Did not remain without attention and work of the metrological services of enterprises. Electronic records can help solve many problems for the organization of data.

SUPPLEMENTARY COMPARISON Bilateral comparison on the calibrations of hydrometers for liquid density between INRIM-Italy and INMETRO-Brazil: SIM.M.D-S2

Science.gov (United States)

Lorefice, Salvatore; Malta, Dalni; Julio Pinheiro, José; Marteleto, Paulo Roberto

2010-01-01

The results of the SIM.M.D-S2 bilateral comparison between INRIM-Italy and INMETRO-Brazil are summarized in this report. The aims of this comparison were to check the stated uncertainty levels and the degrees of equivalence between the two institutes on the calibration of hydrometers for liquid density in the range of 800 kg m-3 to 1000 kg m-3 at 20 ºC, by means of two transfer standards of excellent metrological characteristics. Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/. The final report has been peer-reviewed and approved for publication by SIM, according to the provisions of the CIPM Mutual Recognition Arrangement (MRA).

SimDialog: A visual game dialog editor

OpenAIRE

Owen, C.; Biocca, F.; Bohil, C.; Conley, J.

2008-01-01

SimDialog is a visual editor for dialog in computer games. This paper presents the design of SimDialog, illustrating how script writers and non-programmers can easily create dialog for video games with complex branching structures and dynamic response characteristics. The system creates dialog as a directed graph. This allows for play using the dialog with a state-based cause and effect system that controls selection of non-player character responses and can provide a basic scoring mechanism ...

Quality control of calibration system for area monitors at National Laboratory of Metrology from Ionizing Radiations (LNMRI)

International Nuclear Information System (INIS)

Ramos, M.M.O.; Freitas, L.C. de

1992-01-01

The quality control of equipment used in calibration from the National Laboratory of Metrology on Ionizing Radiations is presented, with results of standard measure systems and irradiation system. Tables and graphics with the quality of systems are also shown. (C.G.C.)

A metrology system for a high resolution cavity beam position monitor system

Science.gov (United States)

Walston, Sean; Boogert, Stewart; Chung, Carl; Fitsos, Pete; Frisch, Joe; Gronberg, Jeff; Hayano, Hitoshi; Hinton, Shantell; Honda, Yosuke; Khainovski, Oleg; Kolomensky, Yury; Loscutoff, Peter; Lyapin, Alexey; Malton, Stephen; May, Justin; McCormick, Douglas; Meller, Robert; Miller, David; Orimoto, Toyoko; Ross, Marc; Slater, Mark; Smith, Steve; Smith, Tonee; Terunuma, Nobuhiro; Thomson, Mark; Urakawa, Junji; Vogel, Vladimir; Ward, David; White, Glen

2013-11-01

International Linear Collider (ILC) interaction region beam sizes and component position stability requirements will likely be as small as a few nanometers. It is important to the ILC design effort to demonstrate that these tolerances can be achieved-ideally using a beam-based stability measurement. We developed a high resolution RF cavity Beam Position Monitor (BPM) system. A triplet of these BPMs, installed in the extraction line of the KEK Accelerator Test Facility (ATF) and tested with its ultra-low emittance beam, achieved a position measurement resolution of 15 nm. A metrology system for the three BPMs was subsequently installed. This system employed optical encoders to measure each BPM's position and orientation relative to a zero-coefficient of thermal expansion carbon fiber frame. We have demonstrated that the three BPMs behave as a rigid-body at the level of less than 5 nm.

SIMS applications in biological research

International Nuclear Information System (INIS)

Prince, K.E.; Burke, P.T.; Kelly, I.J.

2000-01-01

Full text: SIMS has been utilised as a tool for biological research since the early 1970's. SIMS' abilities in isotopic detection with high sensitivity, imaging capabilities at a subcellular level, and the possibility of molecular imaging have been the main areas of interest for biological development. However, whilst hundreds of instruments are available in industrial and university laboratories for semiconductor and materials analysis, only a handful successfully perform biological research. For this reason there is generally a lack of awareness of SIMS by the biological community. Biological SIMS analysis requires a working knowledge of both biology and SIMS. Sample preparation is a critical and time consuming prerequisite for any successful biological SIMS study. In addition, for quantification to be possible a homogeneous, matrix matched standard must be available. Once these difficulties are more widely understood and overcome there will be a greater motivation for the biological community to embrace SIMS as a unique tool in their research. This paper provides an overview of some of the more successful biological SIMS application areas internationally, and summarises the types of biological SIMS requests received by ANSTO

X-diffraction technique applied for nano system metrology

International Nuclear Information System (INIS)

Kuznetsov, Alexei Yu.; Machado, Rogerio; Robertis, Eveline de; Campos, Andrea P.C.; Archanjo, Braulio S.; Gomes, Lincoln S.; Achete, Carlos A.

2009-01-01

The application of nano materials are fast growing in all industrial sectors, with a strong necessity in nano metrology and normalizing in the nano material area. The great potential of the X-ray diffraction technique in this field is illustrated at the example of metals, metal oxides and pharmaceuticals

Metrology and quality control handbook

International Nuclear Information System (INIS)

Hofmann, D.

1983-01-01

This book tries to present the fundamentals of metrology and quality control in brief surveys. Compromises had to be made in order to reduce the material available to a sensible volume for the sake of clarity. This becomes evident by the following two restrictions which had to made: First, in dealing with the theoretical principles of metrology and quality control, mere reference had to be made in many cases to the great variety of special literature without discussing it to explain further details. Second, in dealing with the application of metrology and quality control techniques in practice, only the basic qantities of the International System of Units (SI) could be taken into account as a rule. Some readers will note that many special measuring methods and equipment known to them are not included in this book. I do hope, however, that this short-coming will show to have a positive effect, too. This book will show the reader how to find the basic quantities and units from the derived quantities and units, and the steps that are necessary to solve any kind of measuring task. (orig./RW) [de

Metrology in electricity and magnetism: EURAMET activities today and tomorrow

Science.gov (United States)

Piquemal, F.; Jeckelmann, B.; Callegaro, L.; Hällström, J.; Janssen, T. J. B. M.; Melcher, J.; Rietveld, G.; Siegner, U.; Wright, P.; Zeier, M.

2017-10-01

Metrology dedicated to electricity and magnetism has changed considerably in recent years. It encompasses almost all modern scientific, industrial, and societal challenges, e.g. the revision of the International System of Units, the profound transformation of industry, changes in energy use and generation, health, and environment, as well as nanotechnologies (including graphene and 2D materials) and quantum engineering. Over the same period, driven by the globalization of worldwide trade, the Mutual Recognition Arrangement (referred to as the CIPM MRA) was set up. As a result, the regional metrology organizations (RMOs) of national metrology institutes have grown in significance. EURAMET is the European RMO and has been very prominent in developing a strategic research agenda (SRA) and has established a comprehensive research programme. This paper reviews the highlights of EURAMET in electrical metrology within the European Metrology Research Programme and its main contributions to the CIPM MRA. In 2012 EURAMET undertook an extensive roadmapping exercise for proposed activities for the next decade which will also be discussed in this paper. This work has resulted in a new SRA of the second largest European funding programme: European Metrology Programme for Innovation and Research.

Coordinate metrology accuracy of systems and measurements

CERN Document Server

Sładek, Jerzy A

2016-01-01

This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book...

Characterizing opto-electret based paper speakers by using a real-time projection Moiré metrology system

Science.gov (United States)

Chang, Ya-Ling; Hsu, Kuan-Yu; Lee, Chih-Kung

2016-03-01

Advancement of distributed piezo-electret sensors and actuators facilitates various smart systems development, which include paper speakers, opto-piezo/electret bio-chips, etc. The array-based loudspeaker system possess several advantages over conventional coil speakers, such as light-weightness, flexibility, low power consumption, directivity, etc. With the understanding that the performance of the large-area piezo-electret loudspeakers or even the microfluidic biochip transport behavior could be tailored by changing their dynamic behaviors, a full-field real-time high-resolution non-contact metrology system was developed. In this paper, influence of the resonance modes and the transient vibrations of an arraybased loudspeaker system on the acoustic effect were measured by using a real-time projection moiré metrology system and microphones. To make the paper speaker even more versatile, we combine the photosensitive material TiOPc into the original electret loudspeaker. The vibration of this newly developed opto-electret loudspeaker could be manipulated by illuminating different light-intensity patterns. Trying to facilitate the tailoring process of the opto-electret loudspeaker, projection moiré was adopted to measure its vibration. By recording the projected fringes which are modulated by the contours of the testing sample, the phase unwrapping algorithm can give us a continuous phase distribution which is proportional to the object height variations. With the aid of the projection moiré metrology system, the vibrations associated with each distinctive light pattern could be characterized. Therefore, we expect that the overall acoustic performance could be improved by finding the suitable illuminating patterns. In this manuscript, the system performance of the projection moiré and the optoelectret paper speakers were cross-examined and verified by the experimental results obtained.

Adhesive Bonding for Optical Metrology Systems in Space Applications

International Nuclear Information System (INIS)

Gohlke, Martin; Schuldt, Thilo; Braxmaier, Claus; Döringshoff, Klaus; Peters, Achim; Johann, Ulrich; Weise, Dennis

2015-01-01

Laser based metrology systems become more and more attractive for space applications and are the core elements of planned missions such as LISA (NGO, eLISA) or NGGM where laser interferometry is used for distance measurements between satellites. The GRACE-FO mission will for the first time demonstrate a Laser Ranging Instrument (LRI) in space, starting 2017. Laser based metrology also includes optical clocks/references, either as ultra-stable light source for high sensitivity interferometry or as scientific payload e.g. proposed in fundamental physics missions such as mSTAR (mini SpaceTime Asymmetry Research), a mission dedicated to perform a Kennedy-Thorndike experiment on a satellite in a low-Earth orbit. To enable the use of existing optical laboratory setups, optimization with respect to power consumption, weight and dimensions is necessary. At the same time the thermal and structural stability must be increased. Over the last few years we investigated adhesive bonding of optical components to thermally highly stable glass ceramics as an easy-to-handle assembly integration technology. Several setups were implemented and tested for potential later use in space applications. We realized a heterodyne LISA related interferometer with demonstrated noise levels in the pm-range for translation measurement and nano-radiant-range for tilt measurements and two iodine frequency references on Elegant Breadboard (EBB) and Engineering Model (EM) level with frequency stabilities in the 10 -15 range for longer integration times. The EM setup was thermally cycled and vibration tested. (paper)

SIMS: The SLAC Industrial Measurement System

International Nuclear Information System (INIS)

Bell, B.

1990-01-01

Kern was the first survey company to market an Industrial Measurement System when it released ECDS (Electronic Coordinate Determination System) in the mid-1980s. Originally written for the PDP-11, a version was later released for the PC (ECDS-PC). SLAC purchased this system in 1986 and immediately began to use it for the alignment of the SLC (Stanford Linear Collider). Although ECDS enabled SLAC to perform tasks with a speed never before achieved, they experienced limitations in the software. Since Kern proved unresponsive and SLAC was unable to purchase the source code for any amount of money, they set about writing their own portions of code. They first wrote a system of menus tailored for their specific alignment tasks, and disabled much of the ECDS menu structure. Due to dissatisfaction with the ECDS bundle adjustment program, they wrote their own bundle adjustment in 1988. A further step towarad having their own complete IMS was to develop a data capture program, a task which has been underway since the beginning of this year. They do not yet have data analysis features that are fully integrated, but they do have stand-alone packages that have been written at SLAC. When they first started tinkering with ECDS there was no intention of developing a complete system, but they now have all the elements of such a system - SIMS, the SLAC Industrial Measurement System

Efficiency improvements of offline metrology job creation

Science.gov (United States)

Zuniga, Victor J.; Carlson, Alan; Podlesny, John C.; Knutrud, Paul C.

1999-06-01

Progress of the first lot of a new design through the production line is watched very closely. All performance metrics, cycle-time, in-line measurement results and final electrical performance are critical. Rapid movement of this lot through the line has serious time-to-market implications. Having this material waiting at a metrology operation for an engineer to create a measurement job plan wastes valuable turnaround time. Further, efficient use of a metrology system is compromised by the time required to create and maintain these measurement job plans. Thus, having a method to develop metrology job plans prior to the actual running of the material through the manufacture area can significantly improve both cycle time and overall equipment efficiency. Motorola and Schlumberger have worked together to develop and test such a system. The Remote Job Generator (RJG) created job plans for new device sin a manufacturing process from an NT host or workstation, offline. This increases available system tim effort making production measurements, decreases turnaround time on job plan creation and editing, and improves consistency across job plans. Most importantly this allows job plans for new devices to be available before the first wafers of the device arrive at the tool for measurement. The software also includes a database manager which allows updates of existing job plans to incorporate measurement changes required by process changes or measurement optimization. This paper will review the result of productivity enhancements through the increased metrology utilization and decreased cycle time associated with the use of RJG. Finally, improvements in process control through better control of Job Plans across different devices and layers will be discussed.

Elemental and isotopic imaging of biological samples using NanoSIMS.

Science.gov (United States)

Kilburn, Matt R; Clode, Peta L

2014-01-01

With its low detection limits and the ability to analyze most of the elements in the periodic table, secondary ion mass spectrometry (SIMS) represents one of the most versatile in situ analytical techniques available, and recent developments have resulted in significant advantages for the use of imaging mass spectrometry in biological and biomedical research. Increases in spatial resolution and sensitivity allow detailed interrogation of samples at relevant scales and chemical concentrations. Advances in dynamic SIMS, specifically with the advent of NanoSIMS, now allow the tracking of stable isotopes within biological systems at subcellular length scales, while static SIMS combines subcellular imaging with molecular identification. In this chapter, we present an introduction to the SIMS technique, with particular reference to NanoSIMS, and discuss its application in biological and biomedical research.

A metrology system for a high resolution cavity beam position monitor system

Energy Technology Data Exchange (ETDEWEB)

Walston, Sean, E-mail: walston2@llnl.gov [Lawrence Livermore National Laboratory, 7000 East Ave., L-181, Livermore, CA 94550 (United States); Boogert, Stewart [Royal Holloway, University of London, Egham (United Kingdom); Chung, Carl; Fitsos, Pete [Lawrence Livermore National Laboratory, 7000 East Ave., L-181, Livermore, CA 94550 (United States); Frisch, Joe [Stanford Linear Accelerator Center, Menlo Park, CA (United States); Gronberg, Jeff [Lawrence Livermore National Laboratory, 7000 East Ave., L-181, Livermore, CA 94550 (United States); Hayano, Hitoshi [High Energy Accelerator Research Organization (KEK), Tsukuba-shi, Ibaraki-ken (Japan); Hinton, Shantell [Stanford Linear Accelerator Center, Menlo Park, CA (United States); Honda, Yosuke [High Energy Accelerator Research Organization (KEK), Tsukuba-shi, Ibaraki-ken (Japan); Khainovski, Oleg; Kolomensky, Yury; Loscutoff, Peter [University of California and Lawrence Berkeley National Laboratory, Berkeley, CA (United States); Lyapin, Alexey; Malton, Stephen [University College London, London (United Kingdom); May, Justin; McCormick, Douglas [Stanford Linear Accelerator Center, Menlo Park, CA (United States); Meller, Robert [Cornell University, Ithaca, NY (United States); Miller, David [University College London, London (United Kingdom); Orimoto, Toyoko [University of California and Lawrence Berkeley National Laboratory, Berkeley, CA (United States); California Institute of Technology, Pasadena, CA (United States); Ross, Marc [Stanford Linear Accelerator Center, Menlo Park, CA (United States); Fermi National Accelerator Laboratory, Batavia, IL (United States); and others

2013-11-11

International Linear Collider (ILC) interaction region beam sizes and component position stability requirements will likely be as small as a few nanometers. It is important to the ILC design effort to demonstrate that these tolerances can be achieved–ideally using a beam-based stability measurement. We developed a high resolution RF cavity Beam Position Monitor (BPM) system. A triplet of these BPMs, installed in the extraction line of the KEK Accelerator Test Facility (ATF) and tested with its ultra-low emittance beam, achieved a position measurement resolution of 15 nm. A metrology system for the three BPMs was subsequently installed. This system employed optical encoders to measure each BPM's position and orientation relative to a zero-coefficient of thermal expansion carbon fiber frame. We have demonstrated that the three BPMs behave as a rigid-body at the level of less than 5 nm.

Time and Frequency Transfer Activities at NIST

Science.gov (United States)

2008-12-01

differences. The graph shows data from MJD 54466 to MJD 54763 (January 1, 2008 to October 24, 2008). II.E. The Sistema Interamericano de...Metrologia (SIM) Time Network The Sistema Interamericano de Metrologia (SIM) consists of national metrology institutes (NMIs) located in the 34...designed to mitigate multipath signals. All SIM systems are connected to the Internet and upload their measurement results to Internet Web servers

Vendor-based laser damage metrology equipment supporting the National Ignition Facility

International Nuclear Information System (INIS)

Campbell, J. H; Jennings, R. T.; Kimmons, J. F.; Kozlowski, M. R.; Mouser, R. P.; Schwatz, S.; Stolz, C. J.; Weinzapfel, C. L.

1998-01-01

A sizable laser damage metrology effort is required as part of optics production and installation for the 192 beam National Ignition Facility (NIF) laser. The large quantities, high damage thresholds, and large apertures of polished and coated optics necessitates vendor-based metrology equipment to assure component quality during production. This equipment must be optimized to provide the required information as rapidly as possible with limited operator experience. The damage metrology tools include: (1) platinum inclusion damage test systems for laser amplifier slabs, (2) laser conditioning stations for mirrors and polarizers, and (3) mapping and damage testing stations for UV transmissive optics. Each system includes a commercial Nd:YAG laser, a translation stage for the optics, and diagnostics to evaluate damage. The scanning parameters, optical layout, and diagnostics vary with the test fluences required and the damage morphologies expected. This paper describes the technical objectives and milestones involved in fulfilling these metrology requirements

Self Focusing SIMS: Probing thin film composition in very confined volumes

International Nuclear Information System (INIS)

Franquet, Alexis; Douhard, Bastien; Melkonyan, Davit; Favia, Paola; Conard, Thierry; Vandervorst, Wilfried

2016-01-01

Graphical abstract: - Highlights: • SiGe layers were grown in trenches of various widths (down to 20 nm) on Si substrate and surrounded by SiO 2 films. • Standard SIMS analysis to probe the composition in narrow trenches fails at dimensions less than a micron. • Self Focusing SIMS able to probe thin film composition in very confined volumes (dimension < 20 nm). - Abstract: The continued downscaling of micro and nanoelectronics devices has increased the importance of novel materials and their interfaces very strongly thereby necessitating the availability of adequate metrology and very tight process control as well. For instance, the introduction of materials like SiGe or III-V compounds leads to the need for the determination of the exact composition and thickness of the resulting thin films. Concurrent with this trend, one is faced with layer growth concepts such as aspect ratio trapping, which exploit the reduced dimensionality of the devices. As this leads to films with very different characteristics as compared to their blanket counterparts, characterization now has to be performed on thin films grown in very confined volumes (with dimensions ranging down to less than 10–20 nm) and standard analysis methods like X-Ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry (SIMS) and Rutherford Backscattering Spectrometry, no longer seem applicable due to a lack of spatial resolution. On the other hand, techniques with appropriate spatial resolution like Atom Probe Tomography or Transmission Electron Microscopy are time consuming and suffer from a lack of sensitivity due to their highly localized analysis volume. In this paper, a novel concept termed Self Focusing SIMS, is presented which overcomes the spatial resolution limitations of SIMS without sacrificing the sensitivity. The concept is based on determining the composition of a specific compound using cluster ions which contain the constituents of the compound. Their formation mechanism implies

Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications

DEFF Research Database (Denmark)

Hiller, Jochen; Maisl, Michael; Reindl, Leonard M

2012-01-01

This paper presents physical and metrological characterization measurements conducted for an industrial x-ray micro-computed tomography (CT) system. As is well known in CT metrology, many factors, e.g., in the scanning and reconstruction process, the image processing, and the 3D data evaluation...... components of a CT scanner, i.e. the x-ray tube and the flat-panel detector, are characterized. The contrast and noise transfer property of the scanner is obtained using image-processing methods based on linear systems theory. A long-term temperature measurement in the scanner cabinet has been carried out....... The dimensional measurement property has been quantified by using a calibrated ball-bar and uncertainty budgeting. Information about the performance of a CT scanner system in terms of contrast and noise transmission and sources of geometrical errors will help plan CT scans more efficiently. In particular...

Assisting Sustainable Forest Management and Forest Policy Planning with the Sim4Tree Decision Support System

Directory of Open Access Journals (Sweden)

Floris Dalemans

2015-03-01

Full Text Available As European forest policy increasingly focuses on multiple ecosystem services and participatory decision making, forest managers and policy planners have a need for integrated, user-friendly, broad spectrum decision support systems (DSS that address risks and uncertainties, such as climate change, in a robust way and that provide credible advice in a transparent manner, enabling effective stakeholder involvement. The Sim4Tree DSS has been accordingly developed as a user-oriented, modular and multipurpose toolbox. Sim4Tree supports strategic and tactical forestry planning by providing simulations of forest development, ecosystem services potential and economic performance through time, from a regional to a stand scale, under various management and climate regimes. Sim4Tree allows comparing the performance of different scenarios with regard to diverse criteria so as to optimize management choices. This paper explains the concept, characteristics, functionalities, components and use of the current Sim4Tree DSS v2.5, which was parameterized for the region of Flanders, Belgium, but can be flexibly adapted to allow a broader use. When considering the current challenges for forestry DSS, an effort has been made towards the participatory component and towards integration, while the lack of robustness remains Sim4Tree’s weakest point. However, its structural flexibility allows many possibilities for future improvement and extension.

KEY COMPARISONS: Final report: SIM regional comparison of ac-dc voltage transfer difference (SIM.EM.K6a, SIM.EM-K9 and SIM.EM-K11)

Science.gov (United States)

Campos, Sara; Filipski, Piotr; Izquierdo, Daniel; Afonso, Edson; Landim, Régis P.; Di Lillo, Lucas; Lipe, Thomas

2009-01-01

Three comparisons of ac-dc voltage transfer difference held from January to December 2004 are reported. Six NMIs in the SIM region took part: NRC (Canada), NIST (United States of America), CENAM (Mexico), INTI (Argentina), UTE (Uruguay) and INMETRO (Brazil). The comparisons were proposed to assess the measurement capabilities in ac-dc voltage transfer difference of the NMIs in the SIM region. The test points were selected to link the results with the equivalent CCEM Key Comparisons, through three NMIs participating in both SIM and CCEM key comparisons. Additionally, a SIM.EM-Supplementary comparison was proposed, in support of the SIM NMIs' power/energy meter calibration capabilities. One technical protocol and one travelling standard were used, to economize on time and resources. The report shows the degree of equivalence in the SIM region and also the degree of equivalence with the corresponding CCEM reference value. The results of all participants support the values and uncertainties of the applicable CMC entries for ac-dc voltage transfer difference in the Key Comparison Database held at the BIPM. Main text. To reach the main text of this paper, click on Final Report. Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/. The final report has been peer-reviewed and approved for publication by the CCEM, according to the provisions of the CIPM Mutual Recognition Arrangement (MRA).

A Century of Acoustic Metrology

DEFF Research Database (Denmark)

Rasmussen, Knud

1998-01-01

The development in acoustic measurement technique over the last century is reviewed with special emphasis on the metrological aspect.......The development in acoustic measurement technique over the last century is reviewed with special emphasis on the metrological aspect....

SIM-RIBRAS: A Monte-Carlo simulation package for RIBRAS system

Energy Technology Data Exchange (ETDEWEB)

Leistenschneider, E.; Lepine-Szily, A.; Lichtenthaeler, R. [Departamento de Fisica Nuclear, Instituto de Fisica, Universidade de Sao Paulo (Brazil)

2013-05-06

SIM-RIBRAS is a Root-based Monte-Carlo simulation tool designed to help RIBRAS users on experience planning and experimental setup enhancing and caracterization. It is divided into two main programs: CineRIBRAS, aiming beam kinematics, and SolFocus, aiming beam optics. SIM-RIBRAS replaces other methods and programs used in the past, providing more complete and accurate results and requiring much less manual labour. Moreover, the user can easily make modifications in the codes, adequating it for specific requirements of an experiment.

Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry

Science.gov (United States)

Supranowitz, Chris; Maloney, Chris; Murphy, Paul; Dumas, Paul

2017-10-01

Recent advances in polishing and metrology have addressed many of the challenges in the fabrication and metrology of freeform surfaces, and the manufacture of these surfaces is possible today. However, achieving the form and mid-spatial frequency (MSF) specifications that are typical of visible imaging systems remains a challenge. Interferometric metrology for freeform surfaces is thus highly desirable for such applications, but the capability is currently quite limited for freeforms. In this paper, we provide preliminary results that demonstrate accurate, high-resolution measurements of freeform surfaces using prototype software on QED's ASI™ (Aspheric Stitching Interferometer).

La Metrología Óptica y sus Aplicaciones La Metrología Óptica y sus Aplicaciones

OpenAIRE

Daniel Malacara Hernández

2012-01-01

En este trabajo se presenta una introducción al campo de la metrología óptica y de su herramienta principal que es la interferometría. También se presenta un panorama de los diferentes métodos empleados en metrología describiendo con especial detalle los avances más recientes en este campo. In this work an introduction to optical metrology is presented with a brief description of its main tool which is interferometry. Also, a survey of the main different methods used in optical metrology is ...

World wide matching of registration metrology tools of various generations

Science.gov (United States)

Laske, F.; Pudnos, A.; Mackey, L.; Tran, P.; Higuchi, M.; Enkrich, C.; Roeth, K.-D.; Schmidt, K.-H.; Adam, D.; Bender, J.

2008-10-01

Turn around time/cycle time is a key success criterion in the semiconductor photomask business. Therefore, global mask suppliers typically allocate work loads based on fab capability and utilization capacity. From a logistical point of view, the manufacturing location of a photomask should be transparent to the customer (mask user). Matching capability of production equipment and especially metrology tools is considered a key enabler to guarantee cross site manufacturing flexibility. Toppan, with manufacturing sites in eight countries worldwide, has an on-going program to match the registration metrology systems of all its production sites. This allows for manufacturing flexibility and risk mitigation.In cooperation with Vistec Semiconductor Systems, Toppan has recently completed a program to match the Vistec LMS IPRO systems at all production sites worldwide. Vistec has developed a new software feature which allows for significantly improved matching of LMS IPRO(x) registration metrology tools of various generations. We will report on the results of the global matching campaign of several of the leading Toppan sites.

At-wavelength Optical Metrology Development at the ALS

International Nuclear Information System (INIS)

Yuan, Sheng Sam; Goldberg, Kenneth A.; Yashchuk, Valeriy V.; Celestre, Richard; Mochi, Iacopo; Macdougall, James; Morrison, Gregory Y.; Smith, Brian V.; Domning, Edward E.; McKinney, Wayne R.; Warwick, Tony

2010-01-01

Nano-focusing and brightness preservation for ever brighter synchrotron radiation and free electron laser beamlines require surface slope tolerances of x-ray optics on the order of 100 nrad. While the accuracy of fabrication and ex situ metrology of x-ray mirrors has improved over time, beamline in situ performance of the optics is often limited by application specific factors such as x-ray beam heat loading, temperature drift, alignment, vibration, etc. In the present work, we discuss the recent results from the Advanced Light Source developing high accuracy, in situ, at-wavelength wavefront measurement techniques to surpass 100-nrad accuracy surface slope measurements with reflecting x-ray optics. The techniques will ultimately allow closed-loop feedback systems to be implemented for x-ray nano-focusing. In addition, we present a dedicated metrology beamline endstation, applicable to a wide range of in situ metrology and test experiments. The design and performance of a bendable Kirkpatrick-Baez (KB) mirror with active temperature stabilization will also be presented. The mirror is currently used to study, refine, and optimize in situ mirror alignment, bending and metrology methods essential for nano-focusing application.

Secondary Ion Mass Spectrometry SIMS XI

Science.gov (United States)

Gillen, G.; Lareau, R.; Bennett, J.; Stevie, F.

2003-05-01

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories: Isotopic SIMS Biological SIMS Semiconductor Characterization Techniques and Applications Ultra Shallow Depth Profiling Depth Profiling Fundamental/Modelling and Diffusion Sputter-Induced Topography Fundamentals of Molecular Desorption Organic Materials Practical TOF-SIMS Polyatomic Primary Ions Materials/Surface Analysis Postionization Instrumentation Geological SIMS Imaging Fundamentals of Sputtering Ion Formation and Cluster Formation Quantitative Analysis Environmental/Particle Characterization Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Remote laboratory for phase-aided 3D microscopic imaging and metrology

Science.gov (United States)

Wang, Meng; Yin, Yongkai; Liu, Zeyi; He, Wenqi; Li, Boqun; Peng, Xiang

2014-05-01

In this paper, the establishment of a remote laboratory for phase-aided 3D microscopic imaging and metrology is presented. Proposed remote laboratory consists of three major components, including the network-based infrastructure for remote control and data management, the identity verification scheme for user authentication and management, and the local experimental system for phase-aided 3D microscopic imaging and metrology. The virtual network computer (VNC) is introduced to remotely control the 3D microscopic imaging system. Data storage and management are handled through the open source project eSciDoc. Considering the security of remote laboratory, the fingerprint is used for authentication with an optical joint transform correlation (JTC) system. The phase-aided fringe projection 3D microscope (FP-3DM), which can be remotely controlled, is employed to achieve the 3D imaging and metrology of micro objects.

Metrological Array of Cyber-Physical Systems. Part 3. Smart Energy-Efficient House

Directory of Open Access Journals (Sweden)

Ihor HNES

2015-04-01

Full Text Available Smart energy-efficient houses as the components of Cyber-Physical Systems are developed intensively. The main stream of progress consists in the research of Smart houses’ energy supply. By this option the mentioned objects are advancing from passive houses through net-zero energy houses to active houses that are capable of sharing their own accumulated energy with other components of Cyber-Physical Systems. We consider the problems of studying the metrology models and measuring the heat dissipation in such houses trying to apply network and software achievements as well as the new types of devices with improved characteristics.

Present status of metrology of electro-optical surveillance systems

Science.gov (United States)

Chrzanowski, K.

2017-10-01

There has been a significant progress in equipment for testing electro-optical surveillance systems over the last decade. Modern test systems are increasingly computerized, employ advanced image processing and offer software support in measurement process. However, one great challenge, in form of relative low accuracy, still remains not solved. It is quite common that different test stations, when testing the same device, produce different results. It can even happen that two testing teams, while working on the same test station, with the same tested device, produce different results. Rapid growth of electro-optical technology, poor standardization, limited metrology infrastructure, subjective nature of some measurements, fundamental limitations from laws of physics, tendering rules and advances in artificial intelligence are major factors responsible for such situation. Regardless, next decade should bring significant improvements, since improvement in measurement accuracy is needed to sustain fast growth of electro-optical surveillance technology.

Activities of IPEN Nuclear Metrology Laboratory

International Nuclear Information System (INIS)

Dias, M.S.; Koskinas, M.F.; Pocobi, E.; Silva, C.A.M.; Machado, R.R.

1987-01-01

The activities of IPEN Nuclear Metrology Laboratory, which the principal objective is radionuclides activities determination for supplying sources and standard radioactive solutions in activity are presented. The systems installed, the activity bands and some of standards radionuclides are shown. (C.G.C.) [pt

SAQP pitch walk metrology using single target metrology

Science.gov (United States)

Fang, Fang; Herrera, Pedro; Kagalwala, Taher; Camp, Janay; Vaid, Alok; Pandev, Stilian; Zach, Franz

2017-03-01

Self-aligned quadruple patterning (SAQP) processes have found widespread acceptance in advanced technology nodes to drive device scaling beyond the resolution limitations of immersion scanners. Of the four spaces generated in this process from one lithography pattern two tend to be equivalent as they are derived from the first spacer deposition. The three independent spaces are commonly labelled as α, β and γ. α, β and γ are controlled by multiple process steps including the initial lithographic patterning process, the two mandrel and spacer etches as well as the two spacer depositions. Scatterometry has been the preferred metrology approach, however is restricted to repetitive arrays. In these arrays independent measurements, in particular of alpha and gamma, are not possible due to degeneracy of the standard array targets. . In this work we present a single target approach which lifts the degeneracies commonly encountered while using product relevant layout geometries. We will first describe the metrology approach which includes the previously described SRM (signal response metrology) combined with reference data derived from CD SEM data. The performance of the methodology is shown in figures 1-3. In these figures the optically determined values for alpha, beta and gamma are compared to the CD SEM reference data. The variations are achieved using controlled process experiments varying Mandrel CD and Spacer deposition thicknesses.

OpenSimRoot: widening the scope and application of root architectural models.

Science.gov (United States)

Postma, Johannes A; Kuppe, Christian; Owen, Markus R; Mellor, Nathan; Griffiths, Marcus; Bennett, Malcolm J; Lynch, Jonathan P; Watt, Michelle

2017-08-01

OpenSimRoot is an open-source, functional-structural plant model and mathematical description of root growth and function. We describe OpenSimRoot and its functionality to broaden the benefits of root modeling to the plant science community. OpenSimRoot is an extended version of SimRoot, established to simulate root system architecture, nutrient acquisition and plant growth. OpenSimRoot has a plugin, modular infrastructure, coupling single plant and crop stands to soil nutrient and water transport models. It estimates the value of root traits for water and nutrient acquisition in environments and plant species. The flexible OpenSimRoot design allows upscaling from root anatomy to plant community to estimate the following: resource costs of developmental and anatomical traits; trait synergisms; and (interspecies) root competition. OpenSimRoot can model three-dimensional images from magnetic resonance imaging (MRI) and X-ray computed tomography (CT) of roots in soil. New modules include: soil water-dependent water uptake and xylem flow; tiller formation; evapotranspiration; simultaneous simulation of mobile solutes; mesh refinement; and root growth plasticity. OpenSimRoot integrates plant phenotypic data with environmental metadata to support experimental designs and to gain a mechanistic understanding at system scales. © 2017 The Authors. New Phytologist © 2017 New Phytologist Trust.

8th Brazilian Congress on Metrology (Metrologia 2015)

International Nuclear Information System (INIS)

2016-01-01

THE EIGHTH BRAZILIAN CONGRESS ON METROLOGY (METROLOGIA 2015) The United Nations celebrated 2015 as the International Year of Light. By a curious coincidence, many notable events in science and technology completed a multiple of 50 or 100 years in 2015. From the pioneering work of the wise Ibn Al-Haytham in 1015, through Fresnel, Maxwell, Einstein, the discovery of the cosmic microwave background, to the use of optical fibres in communications in 1965. Electromagnetic radiation is present in our daily lives in countless applications. It is remarkable that there is no way to think about these applications without thinking of measurements. From entangled photons to more prosaic public illumination of our daily life, we are intrinsically connected all the time with the luminous phenomena. Among other things, the light allows global communication on a large scale. It strengthens the internationalization of production processes, which brings considerable changes in relations, processes and economic structures, as well as it orients the social, political and cultural behaviour of any country. These conditions of this internationalization require interchangeability of parts of complex systems, translated into strict adherence to the standards and specifications that use increasingly accurate measurement techniques, as well as the growing demand from consumer markets for products and higher quality services. They also require innovation and improvements in domestic production to boost the competitiveness of industries in domestic and foreign markets. Thus, if the Science of Measurements is taken as a serious concern, countries are better prepared to evolve towards economic and social development. In this 8"t"h edition of the Brazilian Congress on Metrology (METROLOGIA 2015), in addition to the thematic sessions in various areas of Metrology and Conformity Assessment, we hold several satellite events. They are already traditional events or highlight important current issues

QuakeSim 2.0

Science.gov (United States)

Donnellan, Andrea; Parker, Jay W.; Lyzenga, Gregory A.; Granat, Robert A.; Norton, Charles D.; Rundle, John B.; Pierce, Marlon E.; Fox, Geoffrey C.; McLeod, Dennis; Ludwig, Lisa Grant

2012-01-01

QuakeSim 2.0 improves understanding of earthquake processes by providing modeling tools and integrating model applications and various heterogeneous data sources within a Web services environment. QuakeSim is a multisource, synergistic, data-intensive environment for modeling the behavior of earthquake faults individually, and as part of complex interacting systems. Remotely sensed geodetic data products may be explored, compared with faults and landscape features, mined by pattern analysis applications, and integrated with models and pattern analysis applications in a rich Web-based and visualization environment. Integration of heterogeneous data products with pattern informatics tools enables efficient development of models. Federated database components and visualization tools allow rapid exploration of large datasets, while pattern informatics enables identification of subtle, but important, features in large data sets. QuakeSim is valuable for earthquake investigations and modeling in its current state, and also serves as a prototype and nucleus for broader systems under development. The framework provides access to physics-based simulation tools that model the earthquake cycle and related crustal deformation. Spaceborne GPS and Inter ferometric Synthetic Aperture (InSAR) data provide information on near-term crustal deformation, while paleoseismic geologic data provide longerterm information on earthquake fault processes. These data sources are integrated into QuakeSim's QuakeTables database system, and are accessible by users or various model applications. UAVSAR repeat pass interferometry data products are added to the QuakeTables database, and are available through a browseable map interface or Representational State Transfer (REST) interfaces. Model applications can retrieve data from Quake Tables, or from third-party GPS velocity data services; alternatively, users can manually input parameters into the models. Pattern analysis of GPS and seismicity data

Quantum metrology foundation of units and measurements

CERN Document Server

Goebel, Ernst O

2015-01-01

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the...

Computed tomography for dimensional metrology

DEFF Research Database (Denmark)

Kruth, J.P.; Bartscher, M.; Carmignato, S.

2011-01-01

metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional...

SIMS studies of low-K materials

International Nuclear Information System (INIS)

Lin Xuefeng; Smith, Stephen P.

2006-01-01

We report progress in conducting quantitative SIMS analyses of low-K materials. Electron-beam (e-beam) pre-irradiation of SIMS measurement sites was used to study the e-beam-induced effects on SIMS depth profiling of a porous organosilicate low-K material. Pre-irradiation of the sample surface using the e-beam causes a reduction in the thickness of the low-K film. SIMS profiling was used to sputter to identifiable marker positions within the pre-irradiated film. Physical measurement of the thickness of the remaining film was used to show that the e-beam-induced reduction in thickness occurs uniformly throughout the pre-irradiated film. Exposure of the film to the e-beam prior to SIMS analysis also resulted in minor changes in the composition of the film. However, pre-irradiation of the film is not part of the normal SIMS measurement procedure. We conclude that when the e-beam irradiation is used only for charge compensation during SIMS depth profiling, the SIMS analysis of the low-K material will not be significantly affected

Effect of Boron Doping on High-Resolution X-Ray Diffraction Metrology

Science.gov (United States)

Faheem, M.; Zhang, Y.; Dai, X.

2018-03-01

The effect of boron (B) doping on high-resolution X-ray diffraction (HXRD) metrology has been investigated. Twelve samples of Si1-xGex films were epitaxially grown on Si (100) substrates with different thicknesses, germanium (Ge) concentrations and with/without B dopants. Secondary ion mass spectroscopy (SIMS) and HXRD were employed for measurements of B doping, Ge concentration, strain, and thickness of the layers. The SIMS results show the absence of B in two samples while the rest of the samples have B doping in the range of 8.40 × 1018-8.7 × 1020 atoms/cm3 with Ge concentration of 13.3-55.2 at.%. The HXRD measurements indicate the layers thickness of 7.07-108.13 nm along with Ge concentration of 12.82-49.09 at.%. The difference in the Ge concentration measured by SIMS and HXRD was found to deend on B doping. For the undoped samples, the difference is 0.5 at.% and increases with B doping but with no linear proportionality. The difference in the Ge concentration was 7.11 at.% for the highly B-doped (8.7 × 1020 atoms/cm3) sample. The B doping influences the Si1-xGex structure, causing a change in the lattice parameter and producing tensile strains shifting Si1-xGex peaks towards Si (100) substrate peaks in the HXRD diffraction patterns. As a result, Vegard's law is no longer effective and makes a high impact on the HXRD measurement. The comparison between symmetric (004) and asymmetric (+113, +224) reciprocal space mappings (RSM) showed a slight difference in Ge concentration between the undoped and lower B-doped samples. However, there is a change of 0.21 at.% observed for the highly doped Si1-xGex samples. RSM's (+113) demonstrate the small SiGe peak broadening as B doping increases, which indicates a minor crystal distortion.

EQ-10 electrodeless Z-pinch EUV source for metrology applications

Science.gov (United States)

Gustafson, Deborah; Horne, Stephen F.; Partlow, Matthew J.; Besen, Matthew M.; Smith, Donald K.; Blackborow, Paul A.

2011-11-01

With EUV Lithography systems shipping, the requirements for highly reliable EUV sources for mask inspection and resist outgassing are becoming better defined, and more urgent. The sources needed for metrology applications are very different than that needed for lithography; brightness (not power) is the key requirement. Suppliers for HVM EUV sources have all resources working on high power and have not entered the smaller market for metrology. Energetiq Technology has been shipping the EQ-10 Electrodeless Z-pinchTM light source since 19951. The source is currently being used for metrology, mask inspection, and resist development2-4. These applications require especially stable performance in both output power and plasma size and position. Over the last 6 years Energetiq has made many source modifications which have included better thermal management to increase the brightness and power of the source. We now have introduced a new source that will meet requirements of some of the mask metrology first generation tools; this source will be reviewed.

DLP-based 3D metrology by structured light or projected fringe technology for life sciences and industrial metrology

Science.gov (United States)

Frankowski, G.; Hainich, R.

2009-02-01

Since the mid-eighties, a fundamental idea for achieving measuring accuracy in projected fringe technology was to consider the projected fringe pattern as an interferogram and evaluate it on the basis of advanced algorithms widely used for phase measuring in real-time interferometry. A fundamental requirement for obtaining a sufficiently high degree of measuring accuracy with this so-called "phase measuring projected fringe technology" is that the projected fringes, analogous to interference fringes, must have a cos2-shaped intensity distribution. Until the mid-nineties, this requirement for the projected fringe pattern measurement technology presented a basic handicap for its wide application in 3D metrology. This situation changed abruptly, when in the nineties Texas Instruments introduced to the market advanced digital light projection on the basis of micro mirror based projection systems, socalled DLP technology, which also facilitated the generation and projection of cos2-shaped intensity and/or fringe patterns. With this DLP technology, which from its original approach was actually oriented towards completely different applications such as multimedia projection, Texas Instruments boosted phase-measuring fringe projection in optical 3D metrology to a worldwide breakthrough both for medical as well as industrial applications. A subject matter of the lecture will be to present the fundamental principles and the resulting advantages of optical 3D metrology based on phase-measuring fringe projection using DLP technology. Further will be presented and discussed applications of the measurement technology in medical engineering and industrial metrology.

Integrating Training Simulations and e-Learning Systems: The SimSCORM Platform (Integratie van Training Simulaties en e-Learning Systemen: Het SimSCORM Platform)

Science.gov (United States)

2008-07-01

SimSCORM Opdrachtnummer Trainingsconcepten voor Defensie Datum Programmanummer Projectnummer juli 2008 V406 032.13224 Auteur (s) ir H.L.H. de Penning...simulators can provide learners with powerful and realistic learning environments: whereas e-learning systems provide them with interactive, mostly theory ...practice and theory , in both learning and evaluation, is becoming increasingly important. From a learner’s point of view, a powerful learning environment

Quantum metrology in open systems: dissipative Cramér-Rao bound.

Science.gov (United States)

Alipour, S; Mehboudi, M; Rezakhani, A T

2014-03-28

Estimation of parameters is a pivotal task throughout science and technology. The quantum Cramér-Rao bound provides a fundamental limit of precision allowed to be achieved under quantum theory. For closed quantum systems, it has been shown how the estimation precision depends on the underlying dynamics. Here, we propose a general formulation for metrology scenarios in open quantum systems, aiming to relate the precision more directly to properties of the underlying dynamics. This feature may be employed to enhance an estimation precision, e.g., by quantum control techniques. Specifically, we derive a Cramér-Rao bound for a fairly large class of open system dynamics, which is governed by a (time-dependent) dynamical semigroup map. We illustrate the utility of this scenario through three examples.

A Virtual Research Environment for a Secondary Ion Mass Spectrometer (SIMS)

Science.gov (United States)

Wiedenbeck, M.; Schäfer, L.; Klump, J.; Galkin, A.

2013-12-01

Overview: This poster describes the development of a Virtual Research Environment for the Secondary Ion Mass Spectrometer (SIMS) at GFZ Potsdam. Background: Secondary Ion Mass Spectrometers (SIMS) are extremely sensitive instruments for analyzing the surfaces of solid and thin film samples. These instruments are rare, expensive and experienced operators are very highly sought after. As such, measurement time is a precious commodity, until now only accessible to small numbers of researchers. The challenge: The Virtual SIMS Project aims to set up a Virtual Research Environment for the operation of the CAMECA IMS 1280-HR instrument at the GFZ Potsdam. The objective of the VRE is to provide SIMS access not only to researchers locally present in Potsdam but also to scientists working with SIMS cooperation partners in e.g., South Africa, Brazil or India. The requirements: The system should address the complete spectrum of laboratory procedures - from online application for measurement time, to remote access for data acquisition to data archiving for the subsequent publication and for future reuse. The approach: The targeted Virtual SIMS Environment will consist of a: 1. Web Server running the Virtual SIMS website providing general information about the project, lab access proposal forms and calendar for the timing of project related tasks. 2. LIMS Server, responsible for scheduling procedures, data management and, if applicable, accounting and billing. 3. Remote SIMS Tool, devoted to the operation of the experiment within a remote control environment. 4. Publishing System, which supports the publication of results in cooperation with the GFZ Library services. 5. Training Simulator, which offers the opportunity to rehearse experiments and to prepare for possible events such as a power outages or interruptions to broadband services. First results: The SIMS Virtual Research Environment will be mainly based on open source software, the only exception being the CAMECA IMS

Cosensitized Porphyrin System for High-Performance Solar Cells with TOF-SIMS Analysis.

Science.gov (United States)

Wu, Wenjun; Xiang, Huaide; Fan, Wei; Wang, Jinglin; Wang, Haifeng; Hua, Xin; Wang, Zhaohui; Long, Yitao; Tian, He; Zhu, Wei-Hong

2017-05-17

To date, development of organic sensitizers has been predominately focused on light harvesting, highest occupied molecular orbital and lowest unoccupied molecular orbital energy levels, and the electron transferring process. In contrast, their adsorption mode as well as the dynamic loading behavior onto nanoporous TiO 2 is rarely considered. Herein, we have employed the time-of-flight secondary ion mass spectrometry (TOF-SIMS) to gain insight into the competitive dye adsorption mode and kinetics in the cosensitized porphyrin system. Using novel porphyrin dye FW-1 and D-A-π-A featured dye WS-5, the different bond-breaking mode in TOF-SIMS and dynamic dye-loading amount during the coadsorption process are well-compared with two different anchoring groups, such as benzoic acid and cyanoacrylic acid. With the bombardment mode in TOF-SIMS spectra, we have speculated that the cyano group grafts onto nanoporous TiO 2 as tridentate binding for the common anchoring unit of cyanoacrylic acid and confirmed it through extensive first-principles density functional theory calculation by anchoring either the carboxyl or cyano group, which shows that the cyano group can efficiently participate in the adsorption of the WS-5 molecule onto the TiO 2 nanocrystal. The grafting reinforcement interaction between the cyano group and TiO 2 in WS-5 can well-explain the rapid adsorption characteristics. A strong coordinate bond between the lone pair of electrons on the nitrogen or oxygen atom and the Lewis acid sites of TiO 2 can increase electron injection efficiencies with respect to those from the bond between the benzoic acid group and the Brønsted acid sites of the TiO 2 surface. Upon optimization of the coadsorption process with dye WS-5, the photoelectric conversion efficiency based on porphyrin dye FW-1 is increased from 6.14 to 9.72%. The study on the adsorption dynamics of organic sensitizers with TOF-SIMS analysis might provide a new venue for improvement of cosensitized solar

NIF Target Assembly Metrology Methodology and Results

Energy Technology Data Exchange (ETDEWEB)

Alger, E. T. [General Atomics, San Diego, CA (United States); Kroll, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Dzenitis, E. G. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Montesanti, R. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Hughes, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Swisher, M. [IAP, Livermore, CA (United States); Taylor, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Segraves, K. [IAP, Livermore, CA (United States); Lord, D. M. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Reynolds, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Castro, C. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Edwards, G. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

2011-01-01

During our inertial confinement fusion (ICF) experiments at the National Ignition Facility (NIF) we require cryogenic targets at the 1-cm scale to be fabricated, assembled, and metrologized to micron-level tolerances. During assembly of these ICF targets, there are physical dimensmetrology is completed using optical coordinate measurement machines that provide repeatable measurements with micron precision, while also allowing in-process data collection for absolute accuracy in assembly. To date, 51 targets have been assembled and metrologized, and 34 targets have been successfully fielded on NIF relying on these metrology data. In the near future, ignition experiments on NIF will require tighter tolerances and more demanding target assembly and metrology capability. Metrology methods, calculations, and uncertainty estimates will be discussed. Target diagnostic port alignment, target position, and capsule location results will be reviewed for the 2009 Energetics Campaign. The information is presented via control charts showing the effect of process improvements that were made during target production. Certain parameters, including capsule position, met the 2009 campaign specifications but will have much tighter requirements in the future. Finally, in order to meet these new requirements assembly process changes and metrology capability upgrades will be necessary.

Optimal adaptive control for quantum metrology with time-dependent Hamiltonians

Science.gov (United States)

Pang, Shengshi; Jordan, Andrew N.

2017-01-01

Quantum metrology has been studied for a wide range of systems with time-independent Hamiltonians. For systems with time-dependent Hamiltonians, however, due to the complexity of dynamics, little has been known about quantum metrology. Here we investigate quantum metrology with time-dependent Hamiltonians to bridge this gap. We obtain the optimal quantum Fisher information for parameters in time-dependent Hamiltonians, and show proper Hamiltonian control is generally necessary to optimize the Fisher information. We derive the optimal Hamiltonian control, which is generally adaptive, and the measurement scheme to attain the optimal Fisher information. In a minimal example of a qubit in a rotating magnetic field, we find a surprising result that the fundamental limit of T2 time scaling of quantum Fisher information can be broken with time-dependent Hamiltonians, which reaches T4 in estimating the rotation frequency of the field. We conclude by considering level crossings in the derivatives of the Hamiltonians, and point out additional control is necessary for that case. PMID:28276428

Optimal adaptive control for quantum metrology with time-dependent Hamiltonians.

Science.gov (United States)

Pang, Shengshi; Jordan, Andrew N

2017-03-09

Quantum metrology has been studied for a wide range of systems with time-independent Hamiltonians. For systems with time-dependent Hamiltonians, however, due to the complexity of dynamics, little has been known about quantum metrology. Here we investigate quantum metrology with time-dependent Hamiltonians to bridge this gap. We obtain the optimal quantum Fisher information for parameters in time-dependent Hamiltonians, and show proper Hamiltonian control is generally necessary to optimize the Fisher information. We derive the optimal Hamiltonian control, which is generally adaptive, and the measurement scheme to attain the optimal Fisher information. In a minimal example of a qubit in a rotating magnetic field, we find a surprising result that the fundamental limit of T 2 time scaling of quantum Fisher information can be broken with time-dependent Hamiltonians, which reaches T 4 in estimating the rotation frequency of the field. We conclude by considering level crossings in the derivatives of the Hamiltonians, and point out additional control is necessary for that case.

Metrology's role in quality assurance

International Nuclear Information System (INIS)

Zeederberg, L.B.

1982-01-01

Metrology, the science of measurement, is playing an increasing role in modern industry as part of an on-going quality assurance programme. At Escom, quality assurance was critical during the construction of the Koeberg nuclear facility, and also a function in controlling services provided by Escom. This article deals with the role metrology plays in quality assurance

Future metrology needs for FEL reflective optics

International Nuclear Information System (INIS)

Assoufid, L.

2000-01-01

An International Workshop on Metrology for X-ray and Neutron Optics has been held March 16-17, 2000, at the Advanced Photon Source, Argonne National Laboratory, near Chicago, Illinois (USA). The workshop gathered engineers and scientists from both the U.S. and around the world to evaluate metrology instrumentation and methods used to characterize surface figure and finish for long grazing incidence optics used in beamlines at synchrotrons radiation sources. This two-day workshop was motivated by the rapid evolution in the performance of x-ray and neutron sources along with requirements in optics figure and finish. More specifically, the performance of future light sources, such as free-electron laser (FEL)-based x-ray sources, is being pushed to new limits in term of both brilliance and coherence. As a consequence, tolerances on surface figure and finish of the next generation of optics are expected to become tighter. The timing of the workshop provided an excellent opportunity to study the problem, evaluate the state of the art in metrology instrumentation, and stimulate innovation on future metrology instruments and techniques to be used to characterize these optics. This paper focuses on FEL optics and metrology needs. (A more comprehensive summary of the workshop can be found elsewhere.) The performance and limitations of current metrology instrumentation will be discussed and recommendations from the workshop on future metrology development to meet the FEL challenges will be detailed

Future metrology needs for FEL reflective optics.

Energy Technology Data Exchange (ETDEWEB)

Assoufid, L.

2000-09-21

An International Workshop on Metrology for X-ray and Neutron Optics has been held March 16-17, 2000, at the Advanced Photon Source, Argonne National Laboratory, near Chicago, Illinois (USA). The workshop gathered engineers and scientists from both the U.S. and around the world to evaluate metrology instrumentation and methods used to characterize surface figure and finish for long grazing incidence optics used in beamlines at synchrotrons radiation sources. This two-day workshop was motivated by the rapid evolution in the performance of x-ray and neutron sources along with requirements in optics figure and finish. More specifically, the performance of future light sources, such as free-electron laser (FEL)-based x-ray sources, is being pushed to new limits in term of both brilliance and coherence. As a consequence, tolerances on surface figure and finish of the next generation of optics are expected to become tighter. The timing of the workshop provided an excellent opportunity to study the problem, evaluate the state of the art in metrology instrumentation, and stimulate innovation on future metrology instruments and techniques to be used to characterize these optics. This paper focuses on FEL optics and metrology needs. (A more comprehensive summary of the workshop can be found elsewhere.) The performance and limitations of current metrology instrumentation will be discussed and recommendations from the workshop on future metrology development to meet the FEL challenges will be detailed.

Coherence enhanced quantum metrology in a nonequilibrium optical molecule

Science.gov (United States)

Wang, Zhihai; Wu, Wei; Cui, Guodong; Wang, Jin

2018-03-01

We explore the quantum metrology in an optical molecular system coupled to two environments with different temperatures, using a quantum master equation beyond secular approximation. We discover that the steady-state coherence originating from and sustained by the nonequilibrium condition can enhance quantum metrology. We also study the quantitative measures of the nonequilibrium condition in terms of the curl flux, heat current and entropy production at the steady state. They are found to grow with temperature difference. However, an apparent paradox arises considering the contrary behaviors of the steady-state coherence and the nonequilibrium measures in relation to the inter-cavity coupling strength. This paradox is resolved by decomposing the heat current into a population part and a coherence part. Only the latter, the coherence part of the heat current, is tightly connected to the steady-state coherence and behaves similarly with respect to the inter-cavity coupling strength. Interestingly, the coherence part of the heat current flows from the low-temperature reservoir to the high-temperature reservoir, opposite to the direction of the population heat current. Our work offers a viable way to enhance quantum metrology for open quantum systems through steady-state coherence sustained by the nonequilibrium condition, which can be controlled and manipulated to maximize its utility. The potential applications go beyond quantum metrology and extend to areas such as device designing, quantum computation and quantum technology in general.

Laboratorio de Metrología - LABM

OpenAIRE

Jaramillo Ch., Zaira J.

2011-01-01

esos y transacciones de forma transparente y justa para todas las partes involucradas. Una herramienta necesaria para este propósito es la Metrología, ciencia que es utilizada en el Laboratorio de Metrología (LABM) del Centro Experimenta

Chern–Simons theory in SIM(1) superspace

International Nuclear Information System (INIS)

Vohánka, Jiří; Faizal, Mir

2015-01-01

In this paper, we will analyze a three-dimensional supersymmetric Chern–Simons theory in SIM(1) superspace formalism. The breaking of the Lorentz symmetry down to the SIM(1) symmetry breaks half the supersymmetry of the Lorentz invariant theory. So, the supersymmetry of the Lorentz invariant Chern–Simons theory with N=1 supersymmetry will break down to N=1/2 supersymmetry, when the Lorentz symmetry is broken down to the SIM(1) symmetry. First, we will write the Chern–Simons action using SIM(1) projections of N=1 superfields. However, as the SIM(1) transformations of these projections are very complicated, we will define SIM(1) superfields which transform simply under SIM(1) transformations. We will then express the Chern–Simons action using these SIM(1) superfields. Furthermore, we will analyze the gauge symmetry of this Chern–Simons theory. This is the first time that a Chern–Simons theory with N=1/2 supersymmetry will be constructed on a manifold without a boundary

Problems of metrological supply of carbon materials production

International Nuclear Information System (INIS)

Belov, G.V.; Bazilevskij, L.P.; Cherkashina, N.V.

1989-01-01

Carbon materials and products contain internal residual stresses and have an anisotropy of properties therefore special methods of tests are required to control their quality. The main metrological problems during development, production and application of carbon products are: metrological supply of production forms and records during the development of production conditions; metrological supply of quality control of the product; metrological supply of methods for the tests of products and the methods to forecast the characteristics of product quality for the period of quaranteed service life

Metrological analysis of a virtual flowmeter-based transducer for cryogenic helium

Energy Technology Data Exchange (ETDEWEB)

Arpaia, P., E-mail: pasquale.arpaia@unina.it [Department of Electrical Engineering and Information Technology, University of Napoli Federico II, Naples (Italy); Technology Department, European Organization for Nuclear Research (CERN), Geneva (Switzerland); Girone, M., E-mail: mario.girone@cern.ch [Technology Department, European Organization for Nuclear Research (CERN), Geneva (Switzerland); Department of Engineering, University of Sannio, Benevento (Italy); Liccardo, A., E-mail: annalisa.liccardo@unina.it [Department of Electrical Engineering and Information Technology, University of Napoli Federico II, Naples (Italy); Pezzetti, M., E-mail: marco.pezzetti@cern.ch [Technology Department, European Organization for Nuclear Research (CERN), Geneva (Switzerland); Piccinelli, F., E-mail: fabio.piccinelli@cern.ch [Department of Mechanical Engineering, University of Brescia, Brescia (Italy)

2015-12-15

The metrological performance of a virtual flowmeter-based transducer for monitoring helium under cryogenic conditions is assessed. At this aim, an uncertainty model of the transducer, mainly based on a valve model, exploiting finite-element approach, and a virtual flowmeter model, based on the Sereg-Schlumberger method, are presented. The models are validated experimentally on a case study for helium monitoring in cryogenic systems at the European Organization for Nuclear Research (CERN). The impact of uncertainty sources on the transducer metrological performance is assessed by a sensitivity analysis, based on statistical experiment design and analysis of variance. In this way, the uncertainty sources most influencing metrological performance of the transducer are singled out over the input range as a whole, at varying operating and setting conditions. This analysis turns out to be important for CERN cryogenics operation because the metrological design of the transducer is validated, and its components and working conditions with critical specifications for future improvements are identified.

3D molecular imaging SIMS

Energy Technology Data Exchange (ETDEWEB)

Gillen, Greg [Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 (United States)]. E-mail: Greg.gillen@nist.gov; Fahey, Albert [Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 (United States); Wagner, Matt [Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 (United States); Mahoney, Christine [Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 (United States)

2006-07-30

Thin monolayer and bilayer films of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF{sub 5} {sup +} polyatomic primary ion bombardment. Each of these systems exhibited minimal primary beam-induced degradation under cluster ion bombardment allowing molecular depth profiles to be obtained through the film. By combing secondary ion imaging with depth profiling, three-dimensional molecular image depth profiles have been obtained from these systems. In another approach, bevel cross-sections are cut in the samples with the SF{sub 5} {sup +} primary ion beam to produce a laterally magnified cross-section of the sample that does not contain the beam-induced damage that would be induced by conventional focussed ion beam (FIB) cross-sectioning. The bevel surface can then be examined using cluster SIMS imaging or other appropriate microanalysis technique.

Metrology for WEST components design and integration optimization

International Nuclear Information System (INIS)

Brun, C.; Archambeau, G.; Blanc, L.; Bucalossi, J.; Chantant, M.; Gargiulo, L.; Hermenier, A.; Le, R.; Pilia, A.

2015-01-01

Highlights: • Metrology methods. • Interests of metrology campaign to optimize margins by reducing uncertainties. • Assembly problems are solved and validated on a numerical mock up. • Post treatment of full 3DScan of the vacuum vessel. - Abstract: On WEST new components will be implemented in an existing environment, emphasis has to be put on the metrology to optimize the design and the assembly. Hence, at a particular stage of the project, several components have to coexist in the limited vessel. Therefore, all the difficulty consists in validating the mechanical interfaces between existing components and new one; minimize the risk of the assembling and to maximize the plasma volume. The CEA/IRFM takes the opportunity of the ambitious project to sign a partnership with an industrial specialized in multipurpose metrology domains. To optimize the assembly procedure, the IRFM Assembly group works in strong collaboration with its industrial, to define and plan the campaigns of metrology. The paper will illustrate the organization, methods and results of the dedicated metrology campaigns have been defined and carried out in the WEST dis/assembly phase. To conclude, the future needs of metrology at CEA/IRFM will be exposed to define the next steps.

Mycotoxin metrology: Gravimetric production of zearalenone calibration solution

Science.gov (United States)

Rego, E. C. P.; Simon, M. E.; Li, Xiuqin; Li, Xiaomin; Daireaux, A.; Choteau, T.; Westwood, S.; Josephs, R. D.; Wielgosz, R. I.; Cunha, V. S.

2018-03-01

Food safety is a major concern for countries developing metrology and quality assurance systems, including the contamination of food and feed by mycotoxins. To improve the mycotoxin analysis and ensure the metrological traceability, CRM of calibration solution should be used. The production of certified mycotoxin solutions is a major challenge due to the limited amount of standard for conducting a proper purity study and due to the cost of standards. The CBKT project was started at BIPM and Inmetro produced gravimetrically one batch of zearelenone in acetronitrile (14.708 ± 0.016 μg/g, k=2) and conducted homogeneity, stability and value assignment studies.

Remote metrology system (RMS) design concept

Energy Technology Data Exchange (ETDEWEB)

NONE

1995-10-19

A 3D remote metrology system (RMS) is needed to map the interior plasma-facing components of the International Thermonuclear Experimental Reactor (ITER). The performance and survival of these components within the reactor vessel are strongly dependent on their precise alignment and positioning with respect to the plasma edge. Without proper positioning and alignment, plasma-facing surfaces will erode rapidly. A RMS design involving Coleman Research Corporation (CRC) fiber optic coherent laser radar (CLR) technology is examined in this study. The fiber optic CLR approach was selected because its high precision should be able to meet the ITER 0.1 mm accuracy requirement and because the CLR`s fiber optic implementation allows a 3D scanner to operate remotely from the RMS system`s vulnerable components. This design study has largely verified that a fiber optic CLR based RMS can survive the ITER environment and map the ITER interior at the required accuracy at a one measurement/cm{sup 2} density with a total measurement time of less than one hour from each of six or more vertically deployed measurement probes. The design approach employs a sealed and pressurized measurement probe which is attached with an umbilical spiral bellows conduit. This conduit bears fiber optic and electronic links plus a stream of air to lower the temperature in the interior of the probe. Lowering the probe temperature is desirable because probe electromechanical components which could survive the radiation environment often were not rated for the 200 C temperature. The tip of the probe whose outer shell has a flexible bellows joint can swivel in two degrees of freedom to allow mapping operations at each probe deployment level. This design study has concluded that the most successful scanner design will involve a hybrid AO beam deflector and mechanical scanner.

Metrological management evaluation based on ISO10012: an empirical study in ISO-14001-certified Spanish companies

International Nuclear Information System (INIS)

Beltran, Jaime; Rivas, Miguel; Munuzuri, Jesus; Gonzalez, Cristina

2010-01-01

Environmental management systems based on the ISO 14001 standard rely strongly on metrological measurement and confirmation processes to certify the extent to which organizations monitor and improve their environmental behavior. Nevertheless, the literature lacks in studies that assess the influence of these metrological processes on the performance of environmental management in organizations, even now that the international standard ISO 10012 is already available to establish requisites and guidelines for the development of a metrological management system that is compatible with any other standardized management system. This work seeks to assess that influence through the development of an evaluation model for metrological management, which is then validated through an experimental analysis of the results obtained from the application of an audit process in 11 Spanish companies, all ISO-14001-certified and operating in different industrial sectors. (author)

Metrology for ITER Assembly

International Nuclear Information System (INIS)

Bogusch, E.

2006-01-01

The overall dimensions of the ITER Tokamak and the particular assembly sequence preclude the use of conventional optical metrology, mechanical jigs and traditional dimensional control equipment, as used for the assembly of smaller, previous generation, fusion devices. This paper describes the state of the art of the capabilities of available metrology systems, with reference to the previous experience in Fusion engineering and in other industries. Two complementary procedures of transferring datum from the primary datum network on the bioshield to the secondary datum s inside the VV with the desired accuracy of about 0.1 mm is described, one method using the access directly through the ports and the other using transfer techniques, developed during the co-operation with ITER/EFDA. Another important task described is the development of a method for the rapid and easy measurement of the gaps between sectors, required for the production of the customised splice plates between them. The scope of the paper includes the evaluation of the composition and cost of the systems and team of technical staff required to meet the requirements of the assembly procedure. The results from a practical, full-scale demonstration of the methodologies used, using the proposed equipment, is described. This work has demonstrated the feasibility of achieving the necessary accuracies for the successful building of ITER. (author)

Rapid characterisation of surface modifications and treatments using a benchtop SIMS instrument

Science.gov (United States)

McPhail, D. S.; Sokhan, M.; Rees, E. E.; Cliff, B.; Eccles, A. J.; Chater, R. J.

2004-06-01

The development of a novel benchtop SIMS instrument (Millbrook MiniSIMS) [Appl. Surf. Sci. 144 (1999) 106] has brought routine SIMS analysis to many new users, for example museum conservators. This is a result of the simple operation and the relatively low capital cost of the instrument. We report here on the continued development of the system in terms of increasing performance and functionality and its use in museum conservation based applications where a mobile instrument for high throughput, rapid SIMS analysis has proven to be of great benefit to the user. The example we describe here is the application of the MiniSIMS to the analysis of silver thread woven into a silk dress before and after laser cleaning.

Dimensional micro and nano metrology

DEFF Research Database (Denmark)

Hansen, Hans Nørgaard; da Costa Carneiro, Kim; Haitjema, Han

2006-01-01

The need for dimensional micro and nano metrology is evident, and as critical dimensions are scaled down and geometrical complexity of objects is increased, the available technologies appear not sufficient. Major research and development efforts have to be undertaken in order to answer these chal......The need for dimensional micro and nano metrology is evident, and as critical dimensions are scaled down and geometrical complexity of objects is increased, the available technologies appear not sufficient. Major research and development efforts have to be undertaken in order to answer...... these challenges. The developments have to include new measuring principles and instrumentation, tolerancing rules and procedures as well as traceability and calibration. The current paper describes issues and challenges in dimensional micro and nano metrology by reviewing typical measurement tasks and available...

Critical issues in overlay metrology

International Nuclear Information System (INIS)

Sullivan, Neal T.

2001-01-01

In this paper, following an overview of overlay metrology, the difficult relationship of overlay with device performance and yield is discussed and supported with several examples. This is followed by a discussion of the impending collision of metrology equipment performance and 'real' process tolerances for sub 0.18 um technologies. This convergence of tolerance and performance is demonstrated to lead to the current emergence of real-time overlay modeling in a feed-forward/feedback process environment and the associated metrology/sampling implications. This modeling takes advantage of the wealth of understanding concerning the systematic behavior of overlay registration errors. Finally, the impact of new process technologies (RET, OAI, CPSM, CMP, and etc.) on the measurement target is discussed and shown to de-stabilize overlay performance on standard overlay measurement target designs

Radioactivity metrology

International Nuclear Information System (INIS)

Legrand, J.

1979-01-01

Some aspects of the radioactivity metrology are reviewed. Radioactivity primary references; absolute methods of radioactivity measurements used in the Laboratoire de Metrologie des Rayonnements Ionisants; relative measurement methods; traceability through international comparisons and interlaboratory tests; production and distribution of secondary standards [fr

Development of a software system for spatial resolved trace analysis of high performance materials with SIMS

International Nuclear Information System (INIS)

Brunner, Ch. H.

1997-09-01

The following work is separated into two distinctly different parts. The first one is dealing with the SIMSScan software project, an application system for secondary ion mass spectrometry. This application system primarily lays down the foundation, for the research activity introduced in the second part of this work. SIMSScan is an application system designed to provide data acquisition routines for different requirements in the field of secondary ion mass spectroscopy. The whole application package is divided into three major sections, each one dealing with specific measurement tasks. Various supporting clients and wizards, providing extended functionality to the main application, build the core of the software. The MassScan as well as the DepthScan module incorporate the SIMS in the direct imaging or stigmatic mode and are featuring the capabilities for mass spectra recording or depth profile analysis. In combination with an image recording facility the DepthScan module features the capability of spatial resolved material analysis - 3D SIMS. The RasterScan module incorporates the SIMS in scanning mode and supports an fiber optical link for optimized data transfer. The primary goal of this work is to introduce the basic ideas behind the implementation of the main application modules and the supporting clients. Furthermore, it is the intention to lay down the foundation for further developments. At the beginning a short introduction into the paradigm of object oriented programming as well as Windows TM programming is given. Besides explaining the basic ideas behind the Doc/View application architecture the focus is mainly shifted to the routines controlling the SIMS hardware and the basic concepts of multithreaded programming. The elementary structures of the view and document objects is discussed in detail only for the MassScan module, because the ideas behind data abstraction and encapsulation are quite similar. The second part introduces the research activities

FOREWORD: Materials metrology Materials metrology

Science.gov (United States)

Bennett, Seton; Valdés, Joaquin

2010-04-01

It seems that so much of modern life is defined by the materials we use. From aircraft to architecture, from cars to communications, from microelectronics to medicine, the development of new materials and the innovative application of existing ones have underpinned the technological advances that have transformed the way we live, work and play. Recognizing the need for a sound technical basis for drafting codes of practice and specifications for advanced materials, the governments of countries of the Economic Summit (G7) and the European Commission signed a Memorandum of Understanding in 1982 to establish the Versailles Project on Advanced Materials and Standards (VAMAS). This project supports international trade by enabling scientific collaboration as a precursor to the drafting of standards. The VAMAS participants recognized the importance of agreeing a reliable, universally accepted basis for the traceability of the measurements on which standards depend for their preparation and implementation. Seeing the need to involve the wider metrology community, VAMAS approached the Comité International des Poids et Mesures (CIPM). Following discussions with NMI Directors and a workshop at the BIPM in February 2005, the CIPM decided to establish an ad hoc Working Group on the metrology applicable to the measurement of material properties. The Working Group presented its conclusions to the CIPM in October 2007 and published its final report in 2008, leading to the signature of a Memorandum of Understanding between VAMAS and the BIPM. This MoU recognizes the work that is already going on in VAMAS as well as in the Consultative Committees of the CIPM and establishes a framework for an ongoing dialogue on issues of materials metrology. The question of what is meant by traceability in the metrology of the properties of materials is particularly vexed when the measurement results depend on a specified procedure. In these cases, confidence in results requires not only traceable

BioFET-SIM

DEFF Research Database (Denmark)

Hediger, M. R.; Martinez, K. L.; Nygård, J.

2013-01-01

Biosensors based on nanowire field effect transistor (FET) have received much attention in recent years as a way to achieve ultra-sensitive and label-free sensing of molecules of biological interest. The BioFET-SIM computer model permits the analysis and interpretation of experimental sensor...... signals through its web-based interface www.biofetsim.org. The model also allows for predictions of the effects of changes in the experimental setup on the sensor signal. After an introduction to nanowire-based FET biosensors, this chapter reviews the theoretical basis of BioFET-SIM models describing both...... single and multiple charges on the analyte. Afterwards the usage of the interface and its relative command line version is briefly shown. Finally, possible applications of the BioFET-SIM model are presented. Among the possible uses of the interface, the effects on the predicted signal of pH, buffer ionic...

Metrology and ionospheric observation standards

Science.gov (United States)

Panshin, Evgeniy; Minligareev, Vladimir; Pronin, Anton

Accuracy and ionospheric observation validity are urgent trends nowadays. WMO, URSI and national metrological and standardisation services bring forward requirements and descriptions of the ionospheric observation means. Researches in the sphere of metrological and standardisation observation moved to the next level in the Russian Federation. Fedorov Institute of Applied Geophysics (IAG) is in charge of ionospheric observation in the Russian Federation and the National Technical Committee, TC-101 , which was set up on the base of IAG- of the standardisation in the sphere. TC-101 can be the platform for initiation of the core international committee in the network of ISO The new type of the ionosounde “Parus-A” is engineered, which is up to the national requirements. “Parus-A” calibration and test were conducted by National metrological Institute (NMI) -D.I. Mendeleyev Institute for Metrology (VNIIM), signed CIMP MRA in 1991. VNIIM is a basic NMI in the sphere of Space weather (including ionospheric observations), the founder of which was celebrated chemist and metrologist Dmitriy I. Mendeleyev. Tests and calibration were carried out for the 1st time throughout 50-year-history of ionosonde exploitation in Russia. The following metrological characteristics were tested: -measurement range of radiofrequency time delay 0.5-10 ms; -time measurement inaccuracy of radio- frequency pulse ±12mcs; -frequency range of radio impulse 1-20 MHz ; -measurement inaccuracy of radio impulse carrier frequency± 5KHz. For example, the sound impulse simulator that was built-in in the ionosounde was used for measurement range of radiofrequency time delay testing. The number of standards on different levels is developed. - “Ionospheric observation guidance”; - “The Earth ionosphere. Terms and definitions”.

A scalable infrastructure model for carbon capture and storage: SimCCS

International Nuclear Information System (INIS)

Middleton, Richard S.; Bielicki, Jeffrey M.

2009-01-01

In the carbon capture and storage (CCS) process, CO 2 sources and geologic reservoirs may be widely spatially dispersed and need to be connected through a dedicated CO 2 pipeline network. We introduce a scalable infrastructure model for CCS (simCCS) that generates a fully integrated, cost-minimizing CCS system. SimCCS determines where and how much CO 2 to capture and store, and where to build and connect pipelines of different sizes, in order to minimize the combined annualized costs of sequestering a given amount of CO 2 . SimCCS is able to aggregate CO 2 flows between sources and reservoirs into trunk pipelines that take advantage of economies of scale. Pipeline construction costs take into account factors including topography and social impacts. SimCCS can be used to calculate the scale of CCS deployment (local, regional, national). SimCCS' deployment of a realistic, capacitated pipeline network is a major advancement for planning CCS infrastructure. We demonstrate simCCS using a set of 37 CO 2 sources and 14 reservoirs for California. The results highlight the importance of systematic planning for CCS infrastructure by examining the sensitivity of CCS infrastructure, as optimized by simCCS, to varying CO 2 targets. We finish by identifying critical future research areas for CCS infrastructure

Fractal Metrology for biogeosystems analysis

Directory of Open Access Journals (Sweden)

V. Torres-Argüelles

2010-11-01

Full Text Available The solid-pore distribution pattern plays an important role in soil functioning being related with the main physical, chemical and biological multiscale and multitemporal processes of this complex system. In the present research, we studied the aggregation process as self-organizing and operating near a critical point. The structural pattern is extracted from the digital images of three soils (Chernozem, Solonetz and "Chocolate" Clay and compared in terms of roughness of the gray-intensity distribution quantified by several measurement techniques. Special attention was paid to the uncertainty of each of them measured in terms of standard deviation. Some of the applied methods are known as classical in the fractal context (box-counting, rescaling-range and wavelets analyses, etc. while the others have been recently developed by our Group. The combination of these techniques, coming from Fractal Geometry, Metrology, Informatics, Probability Theory and Statistics is termed in this paper Fractal Metrology (FM. We show the usefulness of FM for complex systems analysis through a case study of the soil's physical and chemical degradation applying the selected toolbox to describe and compare the structural attributes of three porous media with contrasting structure but similar clay mineralogy dominated by montmorillonites.

Tools intented to nuclear metrology

International Nuclear Information System (INIS)

Munayco Tasayco, A.F.

1980-08-01

The study undertaken in the metrological laboratory of the C.E.N. Saclay Electronics Services is intended to improve the measurement methods in two fields concerning nuclear instrumentation: the current's measurement in the range 1pA to 0,01 pA and the study of a measurement's system for the linear circuits used in spectrometer gamma ray with semiconductor. Two systems are now working. Its permit an improvement of precision measurement, an automation of the measurement process and many possibilities in the choice of parameters and the laying-out of results [fr

Improving OCD time to solution using Signal Response Metrology

Science.gov (United States)

Fang, Fang; Zhang, Xiaoxiao; Vaid, Alok; Pandev, Stilian; Sanko, Dimitry; Ramanathan, Vidya; Venkataraman, Kartik; Haupt, Ronny

2016-03-01

In recent technology nodes, advanced process and novel integration scheme have challenged the precision limits of conventional metrology; with critical dimensions (CD) of device reduce to sub-nanometer region. Optical metrology has proved its capability to precisely detect intricate details on the complex structures, however, conventional RCWA-based (rigorous coupled wave analysis) scatterometry has the limitations of long time-to-results and lack of flexibility to adapt to wide process variations. Signal Response Metrology (SRM) is a new metrology technique targeted to alleviate the consumption of engineering and computation resources by eliminating geometric/dispersion modeling and spectral simulation from the workflow. This is achieved by directly correlating the spectra acquired from a set of wafers with known process variations encoded. In SPIE 2015, we presented the results of SRM application in lithography metrology and control [1], accomplished the mission of setting up a new measurement recipe of focus/dose monitoring in hours. This work will demonstrate our recent field exploration of SRM implementation in 20nm technology and beyond, including focus metrology for scanner control; post etch geometric profile measurement, and actual device profile metrology.

siMS Score: Simple Method for Quantifying Metabolic Syndrome.

Science.gov (United States)

Soldatovic, Ivan; Vukovic, Rade; Culafic, Djordje; Gajic, Milan; Dimitrijevic-Sreckovic, Vesna

2016-01-01

To evaluate siMS score and siMS risk score, novel continuous metabolic syndrome scores as methods for quantification of metabolic status and risk. Developed siMS score was calculated using formula: siMS score = 2*Waist/Height + Gly/5.6 + Tg/1.7 + TAsystolic/130-HDL/1.02 or 1.28 (for male or female subjects, respectively). siMS risk score was calculated using formula: siMS risk score = siMS score * age/45 or 50 (for male or female subjects, respectively) * family history of cardio/cerebro-vascular events (event = 1.2, no event = 1). A sample of 528 obese and non-obese participants was used to validate siMS score and siMS risk score. Scores calculated as sum of z-scores (each component of metabolic syndrome regressed with age and gender) and sum of scores derived from principal component analysis (PCA) were used for evaluation of siMS score. Variants were made by replacing glucose with HOMA in calculations. Framingham score was used for evaluation of siMS risk score. Correlation between siMS score with sum of z-scores and weighted sum of factors of PCA was high (r = 0.866 and r = 0.822, respectively). Correlation between siMS risk score and log transformed Framingham score was medium to high for age groups 18+,30+ and 35+ (0.835, 0.707 and 0.667, respectively). siMS score and siMS risk score showed high correlation with more complex scores. Demonstrated accuracy together with superior simplicity and the ability to evaluate and follow-up individual patients makes siMS and siMS risk scores very convenient for use in clinical practice and research as well.

An active pixels spectrometers for neutronic fields metrology

International Nuclear Information System (INIS)

Taforeau, Julien

2013-01-01

The fundamental metrology is responsible for the sustainability of the measurement systems and handles to supply the reference standards. Concerning the metrology of ionizing radiations and, in particular the neutron metrology, detectors standards are used to characterize reference fields, in terms of energy and fluence. The dosimeters or particle detectors are calibrated on these reference fields. This thesis presents the development of a neutron spectrometer neutron candidate to the status of primary standard for the characterization of neutron fields in the range from 5 to 20 MeV. The spectrometer uses the recoil proton telescope as detection principle; the CMOS technology, through three sensor positions, is taking advantage to realize the tracking of protons. A Si(Li) detector handles the measure of the residual proton energy. The device simulations, realized under MCNPX, allow to estimate its performances and to validate the neutron energy reconstruction. An essential step of characterization of the telescope elements and in particular of CMOS sensors is also proposed to guarantee the validity of posterior experimental measurements. The tests realized as well in mono-energy fields as in radionuclide source show the very good performances of the system. The quantification of uncertainties indicates an energy estimation with 1.5 % accuracy and a resolution of less than 6 %. The fluence measurement is performed with an uncertainty about 4 to 6%. (author)

Opportunities and Risks in Semiconductor Metrology

Science.gov (United States)

Borden, Peter

2005-09-01

New metrology opportunities are constantly emerging as the semiconductor industry attempts to meet scaling requirements. The paper summarizes some of the key FEOL and BEOL needs. These must be weighed against a number of considerations to ensure that they are good opportunities for the metrology equipment supplier. The paper discusses some of these considerations.

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

Science.gov (United States)

Rerucha, Simon; Yacoot, Andrew; Pham, Tuan M.; Cizek, Martin; Hucl, Vaclav; Lazar, Josef; Cip, Ondrej

2017-04-01

We demonstrated that an iodine stabilized distributed Bragg reflector (DBR) diode based laser system lasing at a wavelength in close proximity to λ =633 nm could be used as an alternative laser source to the helium-neon lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on an interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano)metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.

Quantitative determination of uranium by SIMS

International Nuclear Information System (INIS)

Kuruc, J.; Harvan, D.; Galanda, D.; Matel, L.; Aranyosiova, M.; Velic, D.

2008-01-01

The paper presents results of quantitative measurements of uranium-238 by secondary ion mass spectrometry (SIMS) with using alpha spectrometry as well as complementary technique. Samples with specific activity of uranium-238 were prepared by electrodeposition from aqueous solution of UO 2 (NO 3 ) 2 ·6H 2 O. We tried to apply SIMS to quantitative analysis and search for correlation between intensity obtained from SIMS and activity of uranium-238 in dependence on the surface's weight and possibility of using SIMS in quantitative analysis of environmental samples. The obtained results and correlations as well as results of two real samples measurements are presented in this paper. (authors)

Towards a SIM-Less Existence: The Evolution of Smart Learning Networks

Science.gov (United States)

Al-Khouri, Ali M.

2015-01-01

This article proposes that the widespread availability of wireless networks creates a case in which there is no real need for SIM cards. Recent technological developments offer the capability to outperform SIM cards and provide more innovative dimensions to current systems of mobility. In this context of changing realities in the domain of…

siMS Score: Simple Method for Quantifying Metabolic Syndrome

OpenAIRE

Soldatovic, Ivan; Vukovic, Rade; Culafic, Djordje; Gajic, Milan; Dimitrijevic-Sreckovic, Vesna

2016-01-01

Objective To evaluate siMS score and siMS risk score, novel continuous metabolic syndrome scores as methods for quantification of metabolic status and risk. Materials and Methods Developed siMS score was calculated using formula: siMS score = 2*Waist/Height + Gly/5.6 + Tg/1.7 + TAsystolic/130?HDL/1.02 or 1.28 (for male or female subjects, respectively). siMS risk score was calculated using formula: siMS risk score = siMS score * age/45 or 50 (for male or female subjects, respectively) * famil...

Performance Assessment of a Low-Level Radioactive Waste Disposal Site using GoldSim Integrated Systems Model

Science.gov (United States)

Merrell, G.; Singh, A.; Tauxe, J.; Perona, R.; Dornsife, W.; grisak, G. E.; Holt, R. M.

2011-12-01

Texas Commission on Environmental Quality has approved licenses for four landfills at the Waste Control Specialists (WCS) site located in Andrews County, West Texas. The site includes a hazardous waste landfill and three landfills for radioactive waste. An updated performance assessment is necessary prior to acceptance of waste at the landfills. The updated performance assessment a) provides for more realistic and flexible dose modeling capabilities, b) addresses all plausible release and accident scenarios as they relate to the performance objectives, c) includes impact of climate and hydrologic scenarios that may impact long-term performance of the landfill, d) addresses impact of cover naturalization and degradation on the landfill, and e) incorporates uncertainty and sensitivity analysis for critical parameters. For the updated performance assessment, WCS has developed an integrated systems level performance assessment model using the GoldSim platform. GoldSim serves as a model for integrating all of the major components of a performance assessment, which include the radionuclide source term, facility design, environmental transport pathways, exposure scenarios, and radiological doses. Unlike many computer models that are based on first principles, GoldSim is a systems level model that can be used to integrate and abstract more complex sub-models into one system. This can then be used to assess the results into a unified model of the disposal system and environment. In this particular application, the GoldSim model consists of a) hydrogeologic model that simulates flow and transport through the Dockum geologic unit that underlies all of the waste facilities, b) waste cells that represent the containment unit and simulate degradation of waste forms, radionuclide leaching, and partitioning into the liquid and vapor phase within the waste unit, c) a cover system model that simulates upward diffusive transport from the underground repository to the atmosphere. In

7/5nm logic manufacturing capabilities and requirements of metrology

Science.gov (United States)

Bunday, Benjamin; Bello, A. F.; Solecky, Eric; Vaid, Alok

2018-03-01

This paper will provide an update to previous works [2][4][9] to our view of the future for in-line high volume manufacturing (HVM) metrology for the semiconductor industry, concentrating on logic technology for foundries. First, we will review of the needs of patterned defect, critical dimensional (CD/3D), overlay and films metrology, and present the extensive list of applications for which metrology solutions are needed. We will then update the industry's progress towards addressing gating technical limits of the most important of these metrology solutions, highlighting key metrology technology gaps requiring industry attention and investment.

Slovak Office of Standards, Metrology and Testing. Annual Report 2001

International Nuclear Information System (INIS)

2002-01-01

A brief account of activities carried out by the Slovak Office of Standards, Metrology and Testing of the Slovak Republic in 2001 is presented. These activities are reported under the headings: (1) Introduction by the President of the Slovak Office of Standards, Metrology and Testing; (2) The Vice-president's Unit Standardization and Quality; (3) The President's Office; (4) Chief Inspector Department; (5) Legislative-juridical Department; (6) Department of Economy; (7) Department of International Co-operation; (8) Department of European Integration; (9) Department of Metrology; (10) Department of Testing; (11) Department of the Cyclotron Centre SR; (12) Slovak Institute of Metrology; (13) Slovak Standards Institution; (14) Slovak Metrology Inspectorate; (15) Slovak Legal Metrology; (16) Measuring Techniques - Technocentre - MTT; Abbreviations; (17) Technical Testing Institute Piestany; (18) Testing Institute of Transport and Earthmoving Machinery - SUDST

Improving SysSim's Planetary Occurrence Rate Estimates

Science.gov (United States)

Ashby, Keir; Ragozzine, Darin; Hsu, Danley; Ford, Eric B.

2017-10-01

Kepler's catalog of thousands of transiting planet candidates enables statistical characterization of the underlying planet occurrence rates as a function of period and radius. Due to geometric factors and general noise in measurements, we know that many planets--especially those with a small-radius and/or long-period--were not observed by Kepler.To account for Kepler's detection criteria, Hsu et al. 2017 expanded on work in Lissuaer et al. 2011 to develop the Planetary System Simulator or "SysSim". SysSim uses a forward model to generate simulated catalogs of exoplanet systems, determine which of those simulated planets would have been seen by Kepler in the presence of uncertainties, and then compares those “observed planets” to those actually seen by Kepler. It then uses Approximate Bayesian Computation to infer the posterior probability distributions of the input parameters used to generate the forward model. In Hsu et al. 2017, we focused on matching the observed frequency of planets by solving for the underlying occurrence rate for each bin in a 2-dimensional grid of radius and period. After summarizing the results of Hsu et al. 2017, we show new results that investigate the effect on occurrence rates from including more accurate completeness products (from the Kepler DR25 analysis) into SysSim.

A new approach to stitching optical metrology data

Science.gov (United States)

King, Christopher W.

The next generation of optical instruments, including telescopes and imaging apparatus, will generate an increased requirement for larger and more complex optical forms. A major limiting factor for the production of such optical components is the metrology: how do we measure such parts and with respect to what reference datum This metrology can be thought of as part of a complete cycle in the production of optical components and it is currently the most challenging aspect of production. This thesis investigates a new and complete approach to stitching optical metrology data to extend the effective aperture or, in future, the dynamic range of optical metrology instruments. A practical approach is used to build up a complete process for stitching on piano and spherical parts. The work forms a basis upon which a stitching system for aspheres might be developed in the future, which is inherently more complicated. Beginning with a historical perspective and a review of optical polishing and metrology, the work presented relates the commercially available metrology instruments to the stitching process developed. The stitching is then performed by a numerical optimization routine that seeks to join together overlapping sub-aperture measurements by consideration of the aberrations introduced by the measurement scenario, and by the overlap areas between measurements. The stitching is part of a larger project, the PPARC Optical Manipulation and Metrology project, and was to benefit from new wavefront sensing technology developed by a project partner, and to be used for the sub-aperture measurement. Difficult mathematical problems meant that such a wavefront sensor was not avail able for this work and a work-around was therefore developed using commercial instruments. The techniques developed can be adapted to work on commercial ma chine platforms, and in partuicular, the OMAM NPL/UCL swing-arm profilometer described in chapter 5, or the computer controlled polishing machines

Sims, Christopher Albert (born 1942)

NARCIS (Netherlands)

Boumans, M.; Durlauf, S.N.; Blume, L.E.

2012-01-01

Christopher Sims is one of the leaders in time-series econometrics and empirical macroeconomics and is well known for introducing the VAR approach to econometrics and macroeconomic modelling. Sims' main contribution to empirical macroeconomics was to show how macro-econometric modeling should be

A novel field search and rescue system based on SIM card location

Science.gov (United States)

Zhang, Huihui; Guo, Shutao; Cui, Dejing

2017-06-01

Nowadays, the rapid development of outdoor sports and adventure leads to the increase of the frequency of missing accidents. On the other hand, it becomes much more convenient and efficient for the criminals to escape with the help of new technologies. So we have developed a long-distance raids targeted field search and rescue system which utilizes RSSI ranging and Kalman filtering algorithm to realize remote positioning and dynamic supervision management only by a mobile phone with a SIM card, without any additional terminal equipment.

Remote metrology system (RMS) design concept

International Nuclear Information System (INIS)

1995-01-01

A 3D remote metrology system (RMS) is needed to map the interior plasma-facing components of the International Thermonuclear Experimental Reactor (ITER). The performance and survival of these components within the reactor vessel are strongly dependent on their precise alignment and positioning with respect to the plasma edge. Without proper positioning and alignment, plasma-facing surfaces will erode rapidly. A RMS design involving Coleman Research Corporation (CRC) fiber optic coherent laser radar (CLR) technology is examined in this study. The fiber optic CLR approach was selected because its high precision should be able to meet the ITER 0.1 mm accuracy requirement and because the CLR's fiber optic implementation allows a 3D scanner to operate remotely from the RMS system's vulnerable components. This design study has largely verified that a fiber optic CLR based RMS can survive the ITER environment and map the ITER interior at the required accuracy at a one measurement/cm 2 density with a total measurement time of less than one hour from each of six or more vertically deployed measurement probes. The design approach employs a sealed and pressurized measurement probe which is attached with an umbilical spiral bellows conduit. This conduit bears fiber optic and electronic links plus a stream of air to lower the temperature in the interior of the probe. Lowering the probe temperature is desirable because probe electromechanical components which could survive the radiation environment often were not rated for the 200 C temperature. The tip of the probe whose outer shell has a flexible bellows joint can swivel in two degrees of freedom to allow mapping operations at each probe deployment level. This design study has concluded that the most successful scanner design will involve a hybrid AO beam deflector and mechanical scanner

Research on rapid agile metrology for manufacturing based on real-time multitask operating system

Science.gov (United States)

Chen, Jihong; Song, Zhen; Yang, Daoshan; Zhou, Ji; Buckley, Shawn

1996-10-01

Rapid agile metrology for manufacturing (RAMM) using multiple non-contact sensors is likely to remain a growing trend in manufacturing. High speed inspecting systems for manufacturing is characterized by multitasks implemented in parallel and real-time events which occur simultaneously. In this paper, we introduce a real-time operating system into RAMM research. A general task model of a class-based object- oriented technology is proposed. A general multitask frame of a typical RAMM system using OPNet is discussed. Finally, an application example of a machine which inspects parts held on a carrier strip is described. With RTOS and OPNet, this machine can measure two dimensions of the contacts at 300 parts/second.

National Defense Center of Excellence for Industrial Metrology and 3D Imaging

Science.gov (United States)

2012-10-18

Appendices) W911NF-08-2-0057 - Metrology - FinalReport 100 m to 200 m. For volume determination (e.g., mining , excavations) and topographic mapping...infrastructure, rail systems, mining ), mobile mapping, and security applications. Lockheed Martin has selected the HDL-64E as the main perception...Appendices) W911NF-08-2-0057 - Metrology - FinalReport The Obscurant Penetrating Autosynchronous Lidar ( OPAL ) has been developed as a variant ofNeptec ’s

Metrology in Pharmaceutical Industry - A Case Study

International Nuclear Information System (INIS)

Yuvamoto, Priscila D.; Fermam, Ricardo K. S.; Nascimento, Elizabeth S.

2016-01-01

Metrology is recognized by improving production process, increasing the productivity, giving more reliability to the measurements and consequently, it impacts in the economy of a country. Pharmaceutical area developed GMP (Good Manufacture Practice) requeriments, with no introduction of metrological concepts. However, due to Nanomedicines, it is expected this approach and the consequent positive results. The aim of this work is to verify the level of metrology implementation in a Brazilian pharmaceutical industry, using a case study. The purpose is a better mutual comprehension by both areas, acting together and governmental support to robustness of Brazilian pharmaceutical area. (paper)

Bio-SimVerb and Bio-SimLex: wide-coverage evaluation sets of word similarity in biomedicine.

Science.gov (United States)

Chiu, Billy; Pyysalo, Sampo; Vulić, Ivan; Korhonen, Anna

2018-02-05

Word representations support a variety of Natural Language Processing (NLP) tasks. The quality of these representations is typically assessed by comparing the distances in the induced vector spaces against human similarity judgements. Whereas comprehensive evaluation resources have recently been developed for the general domain, similar resources for biomedicine currently suffer from the lack of coverage, both in terms of word types included and with respect to the semantic distinctions. Notably, verbs have been excluded, although they are essential for the interpretation of biomedical language. Further, current resources do not discern between semantic similarity and semantic relatedness, although this has been proven as an important predictor of the usefulness of word representations and their performance in downstream applications. We present two novel comprehensive resources targeting the evaluation of word representations in biomedicine. These resources, Bio-SimVerb and Bio-SimLex, address the previously mentioned problems, and can be used for evaluations of verb and noun representations respectively. In our experiments, we have computed the Pearson's correlation between performances on intrinsic and extrinsic tasks using twelve popular state-of-the-art representation models (e.g. word2vec models). The intrinsic-extrinsic correlations using our datasets are notably higher than with previous intrinsic evaluation benchmarks such as UMNSRS and MayoSRS. In addition, when evaluating representation models for their abilities to capture verb and noun semantics individually, we show a considerable variation between performances across all models. Bio-SimVerb and Bio-SimLex enable intrinsic evaluation of word representations. This evaluation can serve as a predictor of performance on various downstream tasks in the biomedical domain. The results on Bio-SimVerb and Bio-SimLex using standard word representation models highlight the importance of developing dedicated

7th International Workshop on Advanced Optical Imaging and Metrology

CERN Document Server

2014-01-01

In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imagi...

Metrological large range scanning probe microscope

International Nuclear Information System (INIS)

Dai Gaoliang; Pohlenz, Frank; Danzebrink, Hans-Ulrich; Xu Min; Hasche, Klaus; Wilkening, Guenter

2004-01-01

We describe a metrological large range scanning probe microscope (LR-SPM) with an Abbe error free design and direct interferometric position measurement capability, aimed at versatile traceable topographic measurements that require nanometer accuracy. A dual-stage positioning system was designed to achieve both a large measurement range and a high measurement speed. This dual-stage system consists of a commercially available stage, referred to as nanomeasuring machine (NMM), with a motion range of 25 mmx25 mmx5 mm along x, y, and z axes, and a compact z-axis piezoelectric positioning stage (compact z stage) with an extension range of 2 μm. The metrological LR-SPM described here senses the surface using a stationary fixed scanning force microscope (SFM) head working in contact mode. During operation, lateral scanning of the sample is performed solely by the NMM. Whereas the z motion, controlled by the SFM signal, is carried out by a combination of the NMM and the compact z stage. In this case the compact z stage, with its high mechanical resonance frequency (greater than 20 kHz), is responsible for the rapid motion while the NMM simultaneously makes slower movements over a larger motion range. To reduce the Abbe offset to a minimum the SFM tip is located at the intersection of three interferometer measurement beams orientated in x, y, and z directions. To improve real time performance two high-end digital signal processing (DSP) systems are used for NMM positioning and SFM servocontrol. Comprehensive DSP firmware and Windows XP-based software are implemented, providing a flexible and user-friendly interface. The instrument is able to perform large area imaging or profile scanning directly without stitching small scanned images. Several measurements on different samples such as flatness standards, nanostep height standards, roughness standards as well as sharp nanoedge samples and 1D gratings demonstrate the outstanding metrological capabilities of the instrument

An OCD perspective of line edge and line width roughness metrology

Science.gov (United States)

Bonam, Ravi; Muthinti, Raja; Breton, Mary; Liu, Chi-Chun; Sieg, Stuart; Seshadri, Indira; Saulnier, Nicole; Shearer, Jeffrey; Patlolla, Raghuveer; Huang, Huai

2017-03-01

Metrology of nanoscale patterns poses multiple challenges that range from measurement noise, metrology errors, probe size etc. Optical Metrology has gained a lot of significance in the semiconductor industry due to its fast turn around and reliable accuracy, particularly to monitor in-line process variations. Apart from monitoring critical dimension, thickness of films, there are multiple parameters that can be extracted from Optical Metrology models3. Sidewall angles, material compositions etc., can also be modeled to acceptable accuracy. Line edge and Line Width roughness are much sought of metrology following critical dimension and its uniformity, although there has not been much development in them with optical metrology. Scanning Electron Microscopy is still used as a standard metrology technique for assessment of Line Edge and Line Width roughness. In this work we present an assessment of Optical Metrology and its ability to model roughness from a set of structures with intentional jogs to simulate both Line edge and Line width roughness at multiple amplitudes and frequencies. We also present multiple models to represent roughness and extract relevant parameters from Optical metrology. Another critical aspect of optical metrology setup is correlation of measurement to a complementary technique to calibrate models. In this work, we also present comparison of roughness parameters extracted and measured with variation of image processing conditions on a commercially available CD-SEM tool.

The future of 2D metrology for display manufacturing

Science.gov (United States)

Sandstrom, Tor; Wahlsten, Mikael; Park, Youngjin

2016-10-01

The race to 800 PPI and higher in mobile devices and the transition to OLED displays are driving a dramatic development of mask quality: resolution, CDU, registration, and complexity. 2D metrology for large area masks is necessary and must follow the roadmap. Driving forces in the market place point to continued development of even more dense displays. State-of-the-art metrology has proven itself capable of overlay below 40 nm and registration below 65 nm for G6 masks. Future developments include incoming and recurrent measurements of pellicalized masks at the panel maker's factory site. Standardization of coordinate systems across supplier networks is feasible. This will enable better yield and production economy for both mask and panel maker. Better distortion correction methods will give better registration on the panels and relax the flatness requirements of the mask blanks. If panels are measured together with masks and the results are used to characterize the aligners, further quality and yield improvements are possible. Possible future developments include in-cell metrology and integration with other instruments in the same platform.

Metrological challenges introduced by new tolerancing standards

International Nuclear Information System (INIS)

Morse, Edward; Peng, Yue; Srinivasan, Vijay; Shakarji, Craig

2014-01-01

The recent release of ISO 14405-1 has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity. However, these tools also bring new challenges and pitfalls to an inspector using a coordinate metrology system. A sampling strategy that might have worked well in the past could lead to erroneous results that go undetected when used to evaluate these new specifications. In this paper we investigate how measurement strategies for sampled coordinate metrology systems influence different algorithms for the evaluation of these new specifications. Of particular interest are those specifications where the order statistics of feature cross-sections are required. Here the inspector must decide not only how many points are required for an individual cross-section, but the number and spacing of cross-sections measured on the feature. The results of these decisions are compared with an analytic estimate of the ‘true value’ of the measurand specified using this new standard. (paper)

Secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Grasserbauer, M.

1986-01-01

After an introductory chapter the subject is covered under the following headings: principles and physical fundamentals, measurement equipment, analytic characteristics, sample preparation, special measuring techniques for insulators, analytic procedures and applications of SIMS, summarized evaluation of SIMS. 108 references, 60 figures, and 13 tables are included

Toward reliable and repeatable automated STEM-EDS metrology with high throughput

Science.gov (United States)

Zhong, Zhenxin; Donald, Jason; Dutrow, Gavin; Roller, Justin; Ugurlu, Ozan; Verheijen, Martin; Bidiuk, Oleksii

2018-03-01

New materials and designs in complex 3D architectures in logic and memory devices have raised complexity in S/TEM metrology. In this paper, we report about a newly developed, automated, scanning transmission electron microscopy (STEM) based, energy dispersive X-ray spectroscopy (STEM-EDS) metrology method that addresses these challenges. Different methodologies toward repeatable and efficient, automated STEM-EDS metrology with high throughput are presented: we introduce the best known auto-EDS acquisition and quantification methods for robust and reliable metrology and present how electron exposure dose impacts the EDS metrology reproducibility, either due to poor signalto-noise ratio (SNR) at low dose or due to sample modifications at high dose conditions. Finally, we discuss the limitations of the STEM-EDS metrology technique and propose strategies to optimize the process both in terms of throughput and metrology reliability.

UPWIND 1A2 Metrology. Final Report

DEFF Research Database (Denmark)

Eecen, P.J.; Wagenaar, J.W.; Stefanatos, N.

. Since this problem covers many areas of wind energy, the work package is defined as a crosscutting activity. The objectives of the metrology work package are to develop metrology tools in wind energy to significantly enhance the quality of measurement and testing techniques. The first deliverable...... is a valuable tool for the further assessment and interest has been shown from other work packages, such as Training. This report describes the activities that have been carried out in the Work Package 1A2 Metrology of the UpWind project. Activities from Risø are described in a separate report: T.F. Pedersen...... was to perform a state of the art assessment to identify all relevant measurands. The required accuracies and required sampling frequencies have been identified from the perspective of the users of the data (the other work packages in UpWind). This work led to the definition of the Metrology Database, which...

Impact of the ITRS Metrology Roadmap

International Nuclear Information System (INIS)

Diebold, Alain C.

2001-01-01

The International Technology Roadmap for Semiconductors (ITRS) provides the semiconductor industry with the timing of critical technology needs for future generations of integrated circuits. The Metrology roadmap in the ITRS describes the measurement needs based on the process requirements found in the Lithography, Front End Processes, Interconnect, and Packaging Roadmaps. This paper illustrates the impact of the Metrology Roadmap on the development of key measurement technology

Ion bombardment techniques - recent developments in SIMS

International Nuclear Information System (INIS)

Konarski, P.; Miśnik, M.

2013-01-01

We present a short review of cluster ion bombardment technique recently applied in SIMS. Many advantages of using cluster ion beams are specified over monoatomic ion species. Cluster ions open really new perspectives especially in organic based structures analysis. Nevertheless cluster ions are not the perfect solution and still new ideas of ion erosion in SIMS are needed. Another issue discussed is 'storing matter' technique applied for quantitative analysis in SIMS. Simple idea of sputter deposition of eroded material onto rotating substrate and then analysing the stored material allows to avoid strong matrix effects in SIMS. Presented are the results performed in Tele and Radio Research Institute, Warszawa, Poland. These are the first results of ‘storing matter’ technique performed in one analytical chamber of SIMS instrument. (authors)

A GoldSim Model for Colloid Facilitated Nuclide Transport

International Nuclear Information System (INIS)

Lee, Youn Myoung; Jeong, Jong Tae

2010-01-01

Recently several total system performance assessment (TSPA) programs, called 'template' programs, ready for the safety assessment of radioactive waste repository systems which are conceptually modeled have been developed by utilizing GoldSim and AMBER at KAERI. It is generally believed that chelating agents (chelators) that could be disposed of together with radioactive wastes in the repository and natural colloids available in the geological media affect on nuclides by enhancing their transport in the geological media. A simple GoldSim module to evaluate such quantitative effects, by which colloid and chelator-facilitated nuclide release cases could be modeled and evaluated is introduced. Effects of the chelators alone are illustrated with the case associated with well pumping scenario in a hypothetical repository system

Ambient Optomechanical Alignment and Pupil Metrology for the Flight Instruments Aboard the James Webb Space Telescope

Science.gov (United States)

Coulter, Phillip; Beaton, Alexander; Gum, Jeffrey S.; Hadjimichael, Theodore J.; Hayden, Joseph E.; Hummel, Susann; Hylan, Jason E.; Lee, David; Madison, Timothy J.; Maszkiewicz, Michael;

Study and optimisation of SIMS performed with He+ and Ne+ bombardment

International Nuclear Information System (INIS)

Pillatsch, L.; Vanhove, N.; Dowsett, D.; Sijbrandij, S.; Notte, J.; Wirtz, T.

2013-01-01

The combination of the high-brightness He + /Ne + atomic level ion source with the detection capabilities of secondary ion mass spectrometry (SIMS) opens up the prospect of obtaining chemical information with high lateral resolution and high sensitivity on the Zeiss ORION helium ion microscope (HIM). A feasibility study with He + and Ne + ion bombardment is presented in order to determine the performance of SIMS analyses using the HIM. Therefore, the sputtering yields, useful yields and detection limits obtained for metallic (Al, Ni and W) as well as semiconductor samples (Si, Ge, GaAs and InP) were investigated. All the experiments were performed on a Cameca IMS4f SIMS instrument which was equipped with a caesium evaporator and oxygen flooding system. For most of the elements, useful yields in the range of 10 −4 to 3 × 10 −2 were measured with either O 2 or Cs flooding. SIMS experiments performed directly on the ORION with a prototype secondary ion extraction and detection system lead to results that are consistent with those obtained on the IMS4f. Taking into account the obtained useful yields and the analytical conditions, such as the ion current and typical dwell time on the ORION HIM, detection limits in the at% range and better can be obtained during SIMS imaging at 10 nm lateral resolution with Ne + bombardment and down to the ppm level when a lateral resolution of 100 nm is chosen. Performing SIMS on the HIM with a good detection limit while maintaining an excellent lateral resolution (<50 nm) is therefore very promising.

Metrology for radioactive waste management. (WP2, WP3)

International Nuclear Information System (INIS)

Suran, J.

2014-01-01

The three-year European research project M etrology for Radioactive Waste Management' was launched in October 2011 under the EMRP (European Metrology Research Programme). It involves 13 European national metrology institutes and a total budget exceeds four million Euros. The project is coordinated by the Czech Metrology Institute and is divided into five working groups. In this presentation the Project is described. (author)

Some applications of SIMS in conservation science, archaeometry and cosmochemistry

International Nuclear Information System (INIS)

McPhail, D.S.

2006-01-01

Some applications of SIMS in conservation science, archaeometry and cosmochemistry are described. Ultra-low energy SIMS depth profiling and TOF-SIMS imaging are used to study the corrosion of low-lime glass vessels from the V and A museum. Static SIMS and focused ion beam (FIB) SIMS are used to study the effects of laser cleaning on museum artefacts. Archaeological glass from Raqqa, Syria is studied with FIB-SIMS and micrometeorite impacts on space vessels are studied with FIB and FIB-SIMS. The new analytical challenges provided to the SIMS community by these materials are presented and the ethical issues associated with sampling and destructive analysis discussed

Metrological control of instruments, equipment and measurement system for ultrasonic meters of flow; Controle metrologico de instrumentos, equipamentos e sistema de medicao para medidores ultra-sonicos de vazao

Energy Technology Data Exchange (ETDEWEB)

Palacios, Oscar de

2004-07-01

Following the actual tendency to obtaining greater precision in Natural Gas measurement, in the past few years the use of Ultrasonic Flow Meters as Custody Transfer applications has grown significantly. There are several units currently operating in Brazil. The legislation for model approval, measure system certification and periodical metrological control of the above mentioned equipment, is currently under elaboration final stage. It was placed under public inquire through the 'Portaria 037' of 2004 of INMETRO, which proposes the authorization to perform the Metrological control by the Operator, once it has a quality system implemented according NBR ISO 9001-2000 and/or ISO 17025. This paper describes the verification procedure adopted by most of ultrasonic meters manufacturers. It also describes the application of the procedure for create the 'Metrological Control System of the Measurement System' of a 12'' Ultrasonic Meter installed and operating, with 3 years operation's data. (author)

Establishment of a computer-controlled retroreflection measurement system at the National Metrology Institute of Turkey (UME)

International Nuclear Information System (INIS)

Samedov, Farhad; Celikel, Oguz; Bazkir, Ozcan

2005-01-01

In order to characterize photometric properties of retroreflectors, a fully automated retroreflector measurement system is designed in National Metrology Institute of Turkey (UME). The system is composed of a lighting projector, a goniometer, filter radiometers, 100 dB transimpedance amplifiers, and 24-bit resolution analog-digital converter card with a special software. The established system provides a new calibration capability to determine the luminous intensity and retroreflection coefficients of the retroreflective materials with the expanded uncertainties of 1.07% and 1.13% (k=2), respectively. The traceability in retroreflection measurements was linked to the detector-based photometric scale of UME

Progress in the design and R and D of the ITER In-Vessel Viewing and Metrology System (IVVS)

Energy Technology Data Exchange (ETDEWEB)

Dubus, Gregory, E-mail: gregory.dubus@f4e.europa.eu [Fusion for Energy, c/ Josep Pla, n°2 – Torres Diagonal Litoral – Edificio B3, 08019 Barcelona (Spain); Puiu, Adrian; Bates, Philip; Damiani, Carlo [Fusion for Energy, c/ Josep Pla, n°2 – Torres Diagonal Litoral – Edificio B3, 08019 Barcelona (Spain); Reichle, Roger; Palmer, Jim [ITER Organization, Route de Vinon sur Verdon, 13115 Saint Paul Lez Durance (France)

2014-10-15

The In-Vessel Viewing and Metrology System (IVVS) is a fundamental tool for the ITER machine operations, aiming at performing inspections as well as providing information related to the erosion of in-vessel components, which in turn is related to the amount of mobilised dust present in the Vacuum Vessel. Periodically or on request, the IVVS scanning probes will be deployed into the Vacuum Vessel in order to acquire both visual and metrological data on plasma facing components (blanket, divertor, heating/diagnostic plugs, and test blanket modules). Recent design changes made to the six IVVS port extensions implied the need for a substantial redesign of the IVVS integrated concept – including the scanning probe and its deployment system – in order to bring it to the level of maturity suitable for the Conceptual Design Review. This paper gives an overview of the concept design for IVVS as well as of the various engineering analyses and R and D activities carried out in support to this design: neutronic, seismic and electromagnetic analyses, probe actuation validation under environmental conditions.

SIMS analysis: Development and evaluation 1994 summary report

International Nuclear Information System (INIS)

Groenewold, G.S.; Appelhans, A.D.; Ingram, J.C.; Delmore, J.E.; Dahl, D.A.

1994-12-01

Secondary ion mass spectrometry (SIMS) was evaluated for applicability to the characterization of salt cake and environmental samples. Salt cake is representative of waste found in radioactive waste storage tanks located at Hanford and at other DOE sites; it consists of nitrate, nitrite, hydroxide, and ferrocyanide salts, and the samples form the tanks are extremely radioactive. SIMS is an attractive technology for characterizing these samples because it has the capability for producing speciation information with little or no sample preparation, and it generates no additional waste. Experiments demonstrated that substantial speciation information could be readily generated using SIMS: metal clusters which include nitrate, nitrite, hydroxide, carbonate, cyanide, ferrocyanide and ferricyanide were observed. In addition, the mechanism of SIMS desorption of tributyl phosphate (TBP) was clearly identified, and minimum detection limit studies involving TBP were performed. Procurements leading to the construction of an ion trap SIMS instrument were initiated. Technology transfer of SIMS components to three instrument vendors was initiated. For FY-95, the SIMS evaluation program has been redirected toward identification of metal species on environmental samples

Visualizing Microbial Biogeochemistry: NanoSIMS and Stable Isotope Probing (Invited)

Science.gov (United States)

Pett-Ridge, J.; Weber, P. K.

2009-12-01

Linking phylogenetic information to function in microbial communities is a key challenge for microbial ecology. Isotope-labeling experiments provide a useful means to investigate the ecophysiology of microbial populations and cells in the environment and allow measurement of nutrient transfers between cell types, symbionts and consortia. The combination of Nano-Secondary Ion Mass Spectrometry (NanoSIMS) analysis, in situ labeling and high resolution microscopy allows isotopic analysis to be linked to phylogeny and morphology and holds great promise for fine-scale studies of microbial systems. In NanoSIMS analysis, samples are sputtered with an energetic primary beam (Cs+, O-) liberating secondary ions that are separated by the mass spectrometer and detected in a suite of electron multipliers. Five isotopic species may be analyzed concurrently with spatial resolution as fine as 50nm. A high sensitivity isotope ratio ‘map’ can then be generated for the analyzed area. NanoSIMS images of 13C, 15N and Mo (a nitrogenase co-factor) localization in diazotrophic cyanobacteria show how cells differentially allocate resources within filaments and allow calculation of nutrient uptake rates on a cell by cell basis. Images of AM fungal hyphae-root and cyanobacteria-rhizobia associations indicate the mobilization and sharing (stealing?) of newly fixed C and N. In a related technique, “El-FISH”, stable isotope labeled biomass is probed with oligonucleotide-elemental labels and then imaged by NanoSIMS. In microbial consortia and cyanobacterial mats, this technique helps link microbial structure and function simultaneously even in systems with unknown and uncultivated microbes. Finally, the combination of re-engineered universal 16S oligonucleotide microarrays with NanoSIMS analyses may allow microbial identity to be linked to functional roles in complex systems such as mats and cellulose degrading hindgut communities. These newly developed methods provide correlated

Metrology for environment and climate; Metrologie fuer Umwelt und Klima

Energy Technology Data Exchange (ETDEWEB)

Sommer, Klaus-Dieter [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany). Abt. ' Chemische Physik und Explosionsschutz' ; Spitzer, Petra [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany). Arbeitsgruppe ' Elektrochemie'

2012-12-15

The author describes the observation and monitoring systems developed by the EU and the Federal Republic of Germany. In this connection the metrological aims are described in connection with the activities of the PTB. (HSI)

Joint Research on Scatterometry and AFM Wafer Metrology

NARCIS (Netherlands)

Bodermann, B.; Buhr, E.; Danzebrink, H.U.; Bär, M.; Scholze, F.; Krumrey, M.; Wurm, M.; Klapetek, P.; Hansen, P.E.; Korpelainen, V.; Van Veghel, M.; Yacoot, A.; Siitonen, S.; El Gawhary, O.; Burger, S.; Saastamoinen, T.

2011-01-01

Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both

TOF-SIMS imaging technique with information entropy

International Nuclear Information System (INIS)

Aoyagi, Satoka; Kawashima, Y.; Kudo, Masahiro

2005-01-01

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is capable of chemical imaging of proteins on insulated samples in principal. However, selection of specific peaks related to a particular protein, which are necessary for chemical imaging, out of numerous candidates had been difficult without an appropriate spectrum analysis technique. Therefore multivariate analysis techniques, such as principal component analysis (PCA), and analysis with mutual information defined by information theory, have been applied to interpret SIMS spectra of protein samples. In this study mutual information was applied to select specific peaks related to proteins in order to obtain chemical images. Proteins on insulated materials were measured with TOF-SIMS and then SIMS spectra were analyzed by means of the analysis method based on the comparison using mutual information. Chemical mapping of each protein was obtained using specific peaks related to each protein selected based on values of mutual information. The results of TOF-SIMS images of proteins on the materials provide some useful information on properties of protein adsorption, optimality of immobilization processes and reaction between proteins. Thus chemical images of proteins by TOF-SIMS contribute to understand interactions between material surfaces and proteins and to develop sophisticated biomaterials

La metrología en nuestras vidas

OpenAIRE

Jaramillo, Zaira

2010-01-01

A primera vista, la palabra "Metrología" nos trae a la mente la idea de condiciones meteorológicas. Nada más alejado de la realidad, porque la Meteorología es la disciplina que se encarga de estudiar las condiciones del tiempo y la Metrología se encarga de estudiar las mediciones.

Accurate depth profiling for ultra-shallow implants using backside-SIMS

International Nuclear Information System (INIS)

Hongo, Chie; Tomita, Mitsuhiro; Takenaka, Miyuki

2004-01-01

We studied methods for accurate depth profiling for ultra-shallow implants using backside-SIMS. For the measurement of ultra-shallow profiles, the effects of surface transient and atomic mixing are not negligible. Therefore, we applied backside-SIMS to analyze ultra-shallow doping in order to exclude these effects. Backside-SIMS profiles show a sharper ion implantation tail than surface-side-SIMS profiles. In addition, the primary ion energy dependence becomes weaker when backside-SIMS is used [Surf. Interf. Anal. 29 (2000) 362; Appl. Surf. Sci. 203-204 (2003) 264; J. Vac. Sci. Technol. B 21 (2003) 1422]. However, the peak concentration of the backside sample was lower than that of the surface-side sample. Therefore, the sample flatness was estimated using the SIMS response function. Furthermore, SIMS profiles were simulated using SIMS response functions. This simulation shows how the sample flatness affects the SIMS profile

Differential Evolution for Many-Particle Adaptive Quantum Metrology

NARCIS (Netherlands)

Lovett, N.B.; Crosnier, C.; Perarnau- Llobet, M.; Sanders, B.

2013-01-01

We devise powerful algorithms based on differential evolution for adaptive many-particle quantum metrology. Our new approach delivers adaptive quantum metrology policies for feedback control that are orders-of-magnitude more efficient and surpass the few-dozen-particle limitation arising in methods

Metrological issues in molecular radiotherapy

International Nuclear Information System (INIS)

D'Arienzo, Marco; Capogni, Marco; Smyth, Vere; Cox, Maurice; Johansson, Lena; Bobin, Christophe

2014-01-01

The therapeutic effect from molecular radiation therapy (MRT), on both tumour and normal tissue, is determined by the radiation absorbed dose. Recent research indicates that as a consequence of biological variation across patients the absorbed dose can vary, for the same administered activity, by as much as two orders of magnitude. The international collaborative EURAMET-EMRP project Metrology for molecular radiotherapy (MetroMRT) is addressing this problem. The overall aim of the project is to develop methods of calibrating and verifying clinical dosimetry in MRT. In the present paper an overview of the metrological issues in molecular radiotherapy is provided. (authors)

Radiation protection metrology in Austria: status and needs in a European perspective

International Nuclear Information System (INIS)

Maringer, F. J.; Leitner, A.; Tschurlovits, M.

2005-01-01

A global harmonised system of radiation protection and radiation dosimetry metrology is required to assure quality and accuracy in exchange of ideas, science, technologies and products. Accurate and high-grade measurements of ionising radiation are required in a wide range of industrial and medical applications where they are critical for human health and safety. This paper presents current work of international and Austrian metrological institutions in the field of ionising radiation and briefly discusses the future need and perspectives in the European context.(author)

Metrology and properties of engineering surfaces

CERN Document Server

Greenwood, J; Chetwynd, D

2001-01-01

Metrology and Properties of Engineering Surfaces provides in a single volume a comprehensive and authoritative treatment of the crucial topics involved in the metrology and properties of engineering surfaces. The subject matter is a central issue in manufacturing technology, since the quality and reliability of manufactured components depend greatly upon the selection and qualities of the appropriate materials as ascertained through measurement. The book can in broad terms be split into two parts; the first deals with the metrology of engineering surfaces and covers the important issues relating to the measurement and characterization of surfaces in both two and three dimensions. This covers topics such as filtering, power spectral densities, autocorrelation functions and the use of Fractals in topography. A significant proportion is dedicated to the calibration of scanning probe microscopes using the latest techniques. The remainder of the book deals with the properties of engineering surfaces and covers a w...

Overlay metrology for double patterning processes

Science.gov (United States)

Leray, Philippe; Cheng, Shaunee; Laidler, David; Kandel, Daniel; Adel, Mike; Dinu, Berta; Polli, Marco; Vasconi, Mauro; Salski, Bartlomiej

2009-03-01

The double patterning (DPT) process is foreseen by the industry to be the main solution for the 32 nm technology node and even beyond. Meanwhile process compatibility has to be maintained and the performance of overlay metrology has to improve. To achieve this for Image Based Overlay (IBO), usually the optics of overlay tools are improved. It was also demonstrated that these requirements are achievable with a Diffraction Based Overlay (DBO) technique named SCOLTM [1]. In addition, we believe that overlay measurements with respect to a reference grid are required to achieve the required overlay control [2]. This induces at least a three-fold increase in the number of measurements (2 for double patterned layers to the reference grid and 1 between the double patterned layers). The requirements of process compatibility, enhanced performance and large number of measurements make the choice of overlay metrology for DPT very challenging. In this work we use different flavors of the standard overlay metrology technique (IBO) as well as the new technique (SCOL) to address these three requirements. The compatibility of the corresponding overlay targets with double patterning processes (Litho-Etch-Litho-Etch (LELE); Litho-Freeze-Litho-Etch (LFLE), Spacer defined) is tested. The process impact on different target types is discussed (CD bias LELE, Contrast for LFLE). We compare the standard imaging overlay metrology with non-standard imaging techniques dedicated to double patterning processes (multilayer imaging targets allowing one overlay target instead of three, very small imaging targets). In addition to standard designs already discussed [1], we investigate SCOL target designs specific to double patterning processes. The feedback to the scanner is determined using the different techniques. The final overlay results obtained are compared accordingly. We conclude with the pros and cons of each technique and suggest the optimal metrology strategy for overlay control in double

Metrology for fire experiments in outdoor conditions

CERN Document Server

Silvani, Xavier

2013-01-01

Natural fires can be considered as scale-dependant, non-linear processes of mass, momentum and heat transport, resulting from a turbulent reactive and radiative fluid medium flowing over a complex medium, the vegetal fuel. In natural outdoor conditions, the experimental study of natural fires at real scale needs the development of an original metrology, one able to capture the large range of time and length scales involved in its dynamic nature and also able to resist the thermal, mechanical and chemical aggression of flames on devices. Robust, accurate and poorly intrusive tools must be carefully set-up and used for gaining very fluctuating data over long periods. These signals also need the development of original post-processing tools that take into account the non-steady nature of their stochastic components. Metrology for Fire Experiments in Outdoor Conditions closely analyzes these features, and also describes measurements techniques, the thermal insulation of fragile electronic systems, data acquisitio...

uleSIMS characterization of silver reference surfaces

Science.gov (United States)

Palitsin, V. V.; Dowsett, M. G.; Mata, B. Guzmán de la; Oloff, I. W.; Gibbons, R.

2006-07-01

Ultra low energy SIMS (uleSIMS) is a high sensitivity analytical technique that is normally used for ultra shallow profiling at a depth resolution of up to1 nm. This work describes the use of uleSIMS as both a spectroscopic and depth-profiling tool for the characterization of the early stages of corrosion formed on reference surfaces of silver. These samples are being developed to help with the characterization of tarnished surfaces in a cultural heritage context, and uleSIMS enables the tarnishing to be studied from its very earliest stages due to its high sensitivity (ppm-ppb) and surface specificity. We show that, uleSIMS can be used effectively to study the surface chemistry and aid the development of reference surfaces themselves. In particular, handling contaminants, surface dust, and residues from polishing are relatively easy to identify allowing them to be separated from the parts of the mass spectrum specific to the early stages of corrosion.

Metrology Department - DEMET

International Nuclear Information System (INIS)

1989-01-01

In this report are presented the activities and purposes of the Metrology Dept. of the Institute of Radioprotection and Dosimetry of Brazilian CNEN. It is also presented a list of services rendered by that Dept., the projects in course, personnel and publications.(J.A.M.M.)

A platform for dynamic simulation and control of movement based on OpenSim and MATLAB.

Science.gov (United States)

Mansouri, Misagh; Reinbolt, Jeffrey A

2012-05-11

Numerical simulations play an important role in solving complex engineering problems and have the potential to revolutionize medical decision making and treatment strategies. In this paper, we combine the rapid model-based design, control systems and powerful numerical method strengths of MATLAB/Simulink with the simulation and human movement dynamics strengths of OpenSim by developing a new interface between the two software tools. OpenSim is integrated with Simulink using the MATLAB S-function mechanism, and the interface is demonstrated using both open-loop and closed-loop control systems. While the open-loop system uses MATLAB/Simulink to separately reproduce the OpenSim Forward Dynamics Tool, the closed-loop system adds the unique feature of feedback control to OpenSim, which is necessary for most human movement simulations. An arm model example was successfully used in both open-loop and closed-loop cases. For the open-loop case, the simulation reproduced results from the OpenSim Forward Dynamics Tool with root mean square (RMS) differences of 0.03° for the shoulder elevation angle and 0.06° for the elbow flexion angle. MATLAB's variable step-size integrator reduced the time required to generate the forward dynamic simulation from 7.1s (OpenSim) to 2.9s (MATLAB). For the closed-loop case, a proportional-integral-derivative controller was used to successfully balance a pole on model's hand despite random force disturbances on the pole. The new interface presented here not only integrates the OpenSim and MATLAB/Simulink software tools, but also will allow neuroscientists, physiologists, biomechanists, and physical therapists to adapt and generate new solutions as treatments for musculoskeletal conditions. Copyright © 2012 Elsevier Ltd. All rights reserved.

Metrology for industrial quantum communications: the MIQC project

Science.gov (United States)

Rastello, M. L.; Degiovanni, I. P.; Sinclair, A. G.; Kück, S.; Chunnilall, C. J.; Porrovecchio, G.; Smid, M.; Manoocheri, F.; Ikonen, E.; Kubarsepp, T.; Stucki, D.; Hong, K. S.; Kim, S. K.; Tosi, A.; Brida, G.; Meda, A.; Piacentini, F.; Traina, P.; Natsheh, A. Al; Cheung, J. Y.; Müller, I.; Klein, R.; Vaigu, A.

2014-12-01

The ‘Metrology for Industrial Quantum Communication Technologies’ project (MIQC) is a metrology framework that fosters development and market take-up of quantum communication technologies and is aimed at achieving maximum impact for the European industry in this area. MIQC is focused on quantum key distribution (QKD) technologies, the most advanced quantum-based technology towards practical application. QKD is a way of sending cryptographic keys with absolute security. It does this by exploiting the ability to encode in a photon's degree of freedom specific quantum states that are noticeably disturbed if an eavesdropper trying to decode it is present in the communication channel. The MIQC project has started the development of independent measurement standards and definitions for the optical components of QKD system, since one of the perceived barriers to QKD market success is the lack of standardization and quality assurance.

MediSim: A Prototype VR System for Training Medical First Responders

Energy Technology Data Exchange (ETDEWEB)

Stansfield, S.; Shawver, D.; Sobel, A.

1997-12-31

This paper presents a prototype virtual reality (VR) system for training medical first responders. The initial application is to battlefield medicine and focuses on the training of medical corpsmen and other front-line personnel who might be called upon to provide emergency triage on the battlefield. The system is built upon Sandia`s multi-user, distributed VR platform and provides an interactive, immersive simulation capability. The user is represented by an Avatar and is able to manipulate his virtual instruments and carry out medical procedures. A dynamic casualty simulation provides realistic cues to the patient`s condition (e.g. changing blood pressure and pulse) and responds to the actions of the trainee (e.g. a change in the color of a patient`s skin may result from a check of the capillary refill rate). The current casualty simulation is of an injury resulting in a tension pneumothorax. This casualty model was developed by the University of Pennsylvania and integrated into the Sandia MediSim system.

Industrial Photogrammetry - Accepted Metrology Tool or Exotic Niche

Science.gov (United States)

Bösemann, Werner

2016-06-01

New production technologies like 3D printing and other adaptive manufacturing technologies have changed the industrial manufacturing process, often referred to as next industrial revolution or short industry 4.0. Such Cyber Physical Production Systems combine virtual and real world through digitization, model building process simulation and optimization. It is commonly understood that measurement technologies are the key to combine the real and virtual worlds (eg. [Schmitt 2014]). This change from measurement as a quality control tool to a fully integrated step in the production process has also changed the requirements for 3D metrology solutions. Key words like MAA (Measurement Assisted Assembly) illustrate that new position of metrology in the industrial production process. At the same time it is obvious that these processes not only require more measurements but also systems to deliver the required information in high density in a short time. Here optical solutions including photogrammetry for 3D measurements have big advantages over traditional mechanical CMM's. The paper describes the relevance of different photogrammetric solutions including state of the art, industry requirements and application examples.

INDUSTRIAL PHOTOGRAMMETRY - ACCEPTED METROLOGY TOOL OR EXOTIC NICHE

Directory of Open Access Journals (Sweden)

W. Bösemann

2016-06-01

Full Text Available New production technologies like 3D printing and other adaptive manufacturing technologies have changed the industrial manufacturing process, often referred to as next industrial revolution or short industry 4.0. Such Cyber Physical Production Systems combine virtual and real world through digitization, model building process simulation and optimization. It is commonly understood that measurement technologies are the key to combine the real and virtual worlds (eg. [Schmitt 2014]. This change from measurement as a quality control tool to a fully integrated step in the production process has also changed the requirements for 3D metrology solutions. Key words like MAA (Measurement Assisted Assembly illustrate that new position of metrology in the industrial production process. At the same time it is obvious that these processes not only require more measurements but also systems to deliver the required information in high density in a short time. Here optical solutions including photogrammetry for 3D measurements have big advantages over traditional mechanical CMM’s. The paper describes the relevance of different photogrammetric solutions including state of the art, industry requirements and application examples.

National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN

International Nuclear Information System (INIS)

1992-01-01

The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs

Metrology at Philip Morris Europe

Directory of Open Access Journals (Sweden)

Gualandris R

2014-12-01

Full Text Available The importance of the metrology function at Philip Morris Europe (PME, a multinational organisation producing at over 40 sites in the European, Middle Eastern and African Regions is presented. Standardisation of test methods and equipment as well as the traceability of calibration gauges to the same reference gauge are essential in order to obtain comparable results among the various production centers. The metrology function as well as the qualification of instruments and the drafting of test and calibration operating procedures for this region are conducted or co-ordinated by the Research and Development Department in Neuchatel, Switzerland. In this paper the metrology function within PME is presented based on the measurement of the resistance to draw for which the PME R&D laboratory is accredited (ISO/CEI 17025, as both a calibration and a testing laboratory. The following topics are addressed in this paper: traceability of calibration standards to national standards; comparison of results among manufacturing centres; the choice, the budget as well as the computation of uncertainties. Furthermore, some practical aspects related to the calibration and use of the glass multicapillary gauges are discussed.

Flexible resources for quantum metrology

Science.gov (United States)

Friis, Nicolai; Orsucci, Davide; Skotiniotis, Michalis; Sekatski, Pavel; Dunjko, Vedran; Briegel, Hans J.; Dür, Wolfgang

2017-06-01

Quantum metrology offers a quadratic advantage over classical approaches to parameter estimation problems by utilising entanglement and nonclassicality. However, the hurdle of actually implementing the necessary quantum probe states and measurements, which vary drastically for different metrological scenarios, is usually not taken into account. We show that for a wide range of tasks in metrology, 2D cluster states (a particular family of states useful for measurement-based quantum computation) can serve as flexible resources that allow one to efficiently prepare any required state for sensing, and perform appropriate (entangled) measurements using only single qubit operations. Crucially, the overhead in the number of qubits is less than quadratic, thus preserving the quantum scaling advantage. This is ensured by using a compression to a logarithmically sized space that contains all relevant information for sensing. We specifically demonstrate how our method can be used to obtain optimal scaling for phase and frequency estimation in local estimation problems, as well as for the Bayesian equivalents with Gaussian priors of varying widths. Furthermore, we show that in the paradigmatic case of local phase estimation 1D cluster states are sufficient for optimal state preparation and measurement.

Flexible resources for quantum metrology

International Nuclear Information System (INIS)

Friis, Nicolai; Orsucci, Davide; Skotiniotis, Michalis; Sekatski, Pavel; Dunjko, Vedran; Briegel, Hans J; Dür, Wolfgang

2017-01-01

Quantum metrology offers a quadratic advantage over classical approaches to parameter estimation problems by utilising entanglement and nonclassicality. However, the hurdle of actually implementing the necessary quantum probe states and measurements, which vary drastically for different metrological scenarios, is usually not taken into account. We show that for a wide range of tasks in metrology, 2D cluster states (a particular family of states useful for measurement-based quantum computation) can serve as flexible resources that allow one to efficiently prepare any required state for sensing, and perform appropriate (entangled) measurements using only single qubit operations. Crucially, the overhead in the number of qubits is less than quadratic, thus preserving the quantum scaling advantage. This is ensured by using a compression to a logarithmically sized space that contains all relevant information for sensing. We specifically demonstrate how our method can be used to obtain optimal scaling for phase and frequency estimation in local estimation problems, as well as for the Bayesian equivalents with Gaussian priors of varying widths. Furthermore, we show that in the paradigmatic case of local phase estimation 1D cluster states are sufficient for optimal state preparation and measurement. (paper)

Optical vortex metrology for non-destructive testing

DEFF Research Database (Denmark)

Wang, W.; Hanson, Steen Grüner

2009-01-01

Based on the phase singularities in optical fields, we introduce a new technique, referred to as Optical Vortex Metrology, and demonstrate its application to nano- displacement, flow measurements and biological kinematic analysis.......Based on the phase singularities in optical fields, we introduce a new technique, referred to as Optical Vortex Metrology, and demonstrate its application to nano- displacement, flow measurements and biological kinematic analysis....

Topochemical Analysis of Cell Wall Components by TOF-SIMS.

Science.gov (United States)

Aoki, Dan; Fukushima, Kazuhiko

2017-01-01

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis.

Metrological Reliability of Medical Devices

Science.gov (United States)

Costa Monteiro, E.; Leon, L. F.

2015-02-01

The prominent development of health technologies of the 20th century triggered demands for metrological reliability of physiological measurements comprising physical, chemical and biological quantities, essential to ensure accurate and comparable results of clinical measurements. In the present work, aspects concerning metrological reliability in premarket and postmarket assessments of medical devices are discussed, pointing out challenges to be overcome. In addition, considering the social relevance of the biomeasurements results, Biometrological Principles to be pursued by research and innovation aimed at biomedical applications are proposed, along with the analysis of their contributions to guarantee the innovative health technologies compliance with the main ethical pillars of Bioethics.

Experimental realization of the quantum metrological triangle experiment

Energy Technology Data Exchange (ETDEWEB)

Chenaud, B; Devoille, L; Steck, B; Feltin, N; Gonzalez-Cano, A; Poirier, W; Schopfer, F; Spengler, G; Djordjevic, S; Seron, O; Piquemal, F [Laboratoire national de metrologie et d' essais (LNE), Trappes (France); Lotkhov, S [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany)], E-mail: laurent.devoille@lne.fr

2009-02-01

The quantum metrological triangle experiment (QMTE) consists in realizing Ohm's law with Josephson (JE), quantum Hall (QHE) and single electron tunneling (SET) effects. The aim is to check the consistency of the link among the phenomenological constants K {sub J}, R{sub K} and Q {sub X} involved in these effects and theoretically expressed with the fundamental constants e and h. Such an experiment could be a contribution for a new definition of the systeme international d'unites (SI) base units. In the QMTE, a current generated by a SET device flows through a resistor calibrated against QHE standard and the voltage induced at its terminals is compared to the metrological voltage generated by a Josephson junctions array. At LNE, the studied SET devices are 3 junctions single electron pumps with on chip resistors. The quantized current generated by this pump is theoretically equal to ef (f is the frequency of the driving signals applied on the gates) and is measured through a cryogenic current comparator (CCC), which allows to amplify the low pumping current with a metrological accuracy. We will present and discuss the experimental set-up developed at LNE and the first results. In addition to the main aim of QMTE described above, these preliminary results are also a first step towards a determination of e.

Project Status Update and SIM Science Breadth Discussion for the Origins Subcommittee (OS)

Science.gov (United States)

Marr, James C., IV; Shao, Mike

2003-01-01

This viewgraph presentation is composed of two sections The first reviews the features and the science goals of the Space Interferometry Mission (SIM). The goals are: (1) Perform a search for other planetary systems by surveying 2000 nearby stars for astrometric signatures of planetary companion, (2) Survey a sample of 200 nearby stars for orbiting planets down to terrestrial-type masses (3) Improve best current catalog of star positions by >lOOx and extend to fainter stars to allow extension of stellar knowledge to include our entire galaxy (4) Study dynamics and evolution of stars and star clusters in our galaxy to understand how our galaxy was formed and how it will evolve. (5) Calibrate luminosities of important stars and cosmological distance indicators to improve our understanding of stellar processes and to measure precise distance in the distant universe. The presentation also reviews the accomplishments since 2002, the plans for the subsequent 6 months. The second entitled "The Breadth of SIM Science," reviews SIM science goals in a larger context. SIM will serve to complement and pave the way for the Terrestrial Planet Finder (TPF). SIM observations of the motions of stars will tell us about the distribution of all gravitating mass (light plus dark matter) in the Galaxy. SIM observations of the motions of dwarf galaxies around our own will determine the mass distribution (light plus dark matter in the Halo. SIM will greatly extend these observations to test the theories of accretion disks around super massive black holes. SIM has advantages for studying AGN and other very compact objects.

Neural network approximation of nonlinearity in laser nano-metrology system based on TLMI

Energy Technology Data Exchange (ETDEWEB)

Olyaee, Saeed; Hamedi, Samaneh, E-mail: s_olyaee@srttu.edu [Nano-photonics and Optoelectronics Research Laboratory (NORLab), Faculty of Electrical and Computer Engineering, Shahid Rajaee Teacher Training University (SRTTU), Lavizan, 16788, Tehran (Iran, Islamic Republic of)

2011-02-01

In this paper, an approach based on neural network (NN) for nonlinearity modeling in a nano-metrology system using three-longitudinal-mode laser heterodyne interferometer (TLMI) for length and displacement measurements is presented. We model nonlinearity errors that arise from elliptically and non-orthogonally polarized laser beams, rotational error in the alignment of laser head with respect to the polarizing beam splitter, rotational error in the alignment of the mixing polarizer, and unequal transmission coefficients in the polarizing beam splitter. Here we use a neural network algorithm based on the multi-layer perceptron (MLP) network. The simulation results show that multi-layer feed forward perceptron network is successfully applicable to real noisy interferometer signals.

Neural network approximation of nonlinearity in laser nano-metrology system based on TLMI

International Nuclear Information System (INIS)

Olyaee, Saeed; Hamedi, Samaneh

2011-01-01

In this paper, an approach based on neural network (NN) for nonlinearity modeling in a nano-metrology system using three-longitudinal-mode laser heterodyne interferometer (TLMI) for length and displacement measurements is presented. We model nonlinearity errors that arise from elliptically and non-orthogonally polarized laser beams, rotational error in the alignment of laser head with respect to the polarizing beam splitter, rotational error in the alignment of the mixing polarizer, and unequal transmission coefficients in the polarizing beam splitter. Here we use a neural network algorithm based on the multi-layer perceptron (MLP) network. The simulation results show that multi-layer feed forward perceptron network is successfully applicable to real noisy interferometer signals.

Metrological Array of Cyber-Physical Systems. Part 11. Remote Error Correction of Measuring Channel

Directory of Open Access Journals (Sweden)

Yuriy YATSUK

2015-09-01

Full Text Available The multi-channel measuring instruments with both the classical structure and the isolated one is identified their errors major factors basing on general it metrological properties analysis. Limiting possibilities of the remote automatic method for additive and multiplicative errors correction of measuring instruments with help of code-control measures are studied. For on-site calibration of multi- channel measuring instruments, the portable voltage calibrators structures are suggested and their metrological properties while automatic errors adjusting are analysed. It was experimentally envisaged that unadjusted error value does not exceed ± 1 mV that satisfies most industrial applications. This has confirmed the main approval concerning the possibilities of remote errors self-adjustment as well multi- channel measuring instruments as calibration tools for proper verification.

Optics for Processes, Products and Metrology

Science.gov (United States)

Mather, George

1999-04-01

Optical physics has a variety of applications in industry, including process inspection, coatings development, vision instrumentation, spectroscopy, and many others. Optics has been used extensively in the design of solar energy collection systems and coatings, for example. Also, with the availability of good CCD cameras and fast computers, it has become possible to develop real-time inspection and metrology devices that can accommodate the high throughputs encountered in modern production processes. More recently, developments in moiré interferometry show great promise for applications in the basic metals and electronics industries. The talk will illustrate applications of optics by discussing process inspection techniques for defect detection, part dimensioning, birefringence measurement, and the analysis of optical coatings in the automotive, glass, and optical disc industries. In particular, examples of optical techniques for the quality control of CD-R, MO, and CD-RW discs will be presented. In addition, the application of optical concepts to solar energy collector design and to metrology by moiré techniques will be discussed. Finally, some of the modern techniques and instruments used for qualitative and quantitative material analysis will be presented.

A focal plane metrology system and PSF centroiding experiment

Science.gov (United States)

Li, Haitao; Li, Baoquan; Cao, Yang; Li, Ligang

2016-10-01

In this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.

Experimental Demonstration of Higher Precision Weak-Value-Based Metrology Using Power Recycling

Science.gov (United States)

Wang, Yi-Tao; Tang, Jian-Shun; Hu, Gang; Wang, Jian; Yu, Shang; Zhou, Zong-Quan; Cheng, Ze-Di; Xu, Jin-Shi; Fang, Sen-Zhi; Wu, Qing-Lin; Li, Chuan-Feng; Guo, Guang-Can

2016-12-01

The weak-value-based metrology is very promising and has attracted a lot of attention in recent years because of its remarkable ability in signal amplification. However, it is suggested that the upper limit of the precision of this metrology cannot exceed that of classical metrology because of the low sample size caused by the probe loss during postselection. Nevertheless, a recent proposal shows that this probe loss can be reduced by the power-recycling technique, and thus enhance the precision of weak-value-based metrology. Here we experimentally realize the power-recycled interferometric weak-value-based beam-deflection measurement and obtain the amplitude of the detected signal and white noise by discrete Fourier transform. Our results show that the detected signal can be strengthened by power recycling, and the power-recycled weak-value-based signal-to-noise ratio can surpass the upper limit of the classical scheme, corresponding to the shot-noise limit. This work sheds light on higher precision metrology and explores the real advantage of the weak-value-based metrology over classical metrology.

DynaSim: A MATLAB Toolbox for Neural Modeling and Simulation.

Science.gov (United States)

Sherfey, Jason S; Soplata, Austin E; Ardid, Salva; Roberts, Erik A; Stanley, David A; Pittman-Polletta, Benjamin R; Kopell, Nancy J

2018-01-01

DynaSim is an open-source MATLAB/GNU Octave toolbox for rapid prototyping of neural models and batch simulation management. It is designed to speed up and simplify the process of generating, sharing, and exploring network models of neurons with one or more compartments. Models can be specified by equations directly (similar to XPP or the Brian simulator) or by lists of predefined or custom model components. The higher-level specification supports arbitrarily complex population models and networks of interconnected populations. DynaSim also includes a large set of features that simplify exploring model dynamics over parameter spaces, running simulations in parallel using both multicore processors and high-performance computer clusters, and analyzing and plotting large numbers of simulated data sets in parallel. It also includes a graphical user interface (DynaSim GUI) that supports full functionality without requiring user programming. The software has been implemented in MATLAB to enable advanced neural modeling using MATLAB, given its popularity and a growing interest in modeling neural systems. The design of DynaSim incorporates a novel schema for model specification to facilitate future interoperability with other specifications (e.g., NeuroML, SBML), simulators (e.g., NEURON, Brian, NEST), and web-based applications (e.g., Geppetto) outside MATLAB. DynaSim is freely available at http://dynasimtoolbox.org. This tool promises to reduce barriers for investigating dynamics in large neural models, facilitate collaborative modeling, and complement other tools being developed in the neuroinformatics community.

Dimensional quality control of Ti-Ni dental file by optical coordinate metrology and computed tomography

DEFF Research Database (Denmark)

Yagüe-Fabra, J.A.; Tosello, Guido; Ontiveros, S.

2014-01-01

Endodontic dental files usually present complex 3D geometries, which make the complete measurement of the component very challenging with conventional micro metrology tools. Computed Tomography (CT) can represent a suitable alternative solution to micro metrology tools based on optical and tactile...... techniques. However, the establishment of CT systems traceability when measuring 3D complex geometries is still an open issue. In this work, to verify the quality of the CT dimensional measurements, the dental file has been measured both with a μCT system and an optical CMM (OCMM). The uncertainty...

Mirror surface metrology and polishing for AXAF/TMA

International Nuclear Information System (INIS)

Slomba, A.; Babish, R.; Glenn, P.

1985-01-01

The achievement of the derived goals for mirror surface quality on the Advanced X-ray Astrophysics Facility (AXAF), Technology Mirror Assembly (TMA) required a combination of state-of-the-art metrology and polishing techniques. In this paper, the authors summarize the derived goals and cover the main facets of the various metrology instruments employed, as well as the philosophy and technique used in the polishing work. In addition, they show how progress was measured against the goals, using the detailed error budget for surface errors and a mathematical model for performance prediction. The metrology instruments represented a considerable advance on the state-of-the-art and fully satisfied the error budget goals for the various surface errors. They were capable of measuring the surface errors over a large range of spatial periods, from low-frequency figure errors to microroughness. The polishing was accomplished with a computer-controlled process, guided by the combined data from various metrology instruments. This process was also tailored to reduce the surface errors over the full range of spatial periods

European Congress on Optics Applied to Metrology /METROP/, 2nd, Strasbourg, France, November 26-30, 1979, Proceedings

International Nuclear Information System (INIS)

Grosmann, M.; Meyrueis, P.

1980-01-01

The paper deals with speckle metrology, advances in classical optical metrology and measurement, and holographic metrology. Specific topics include hybrid holographic computer image processing, a speckle method of flow velocity measurement, the measurement of vibratory strains on turbine blades by speckle photography, the use of optical heterodyning and the Doppler effect in laser vibrometers and anemometers, subpicosecond dye lasers for optical metrology, and laser-beam scanning for remote control. Holographic interferometry of brittle materials is discussed, along with a system for the automatic analysis of holographic interferograms, the measurement of surface tension by holographic interferometry, nondestructive testing by means of holographic interferometry, real-time holographic interferometry of heat transfer at the surface of cold solar collectors, and the effective practical use of holography and related technologies in industry

European research project 'Metrology for radioactive waste management'

International Nuclear Information System (INIS)

Suran, J.

2014-01-01

The three-year European research project M etrology for Radioactive Waste Management' was launched in October 2011 under the EMRP (European Metrology Research Programme). It involves 13 European national metrology institutes and a total budget exceeds four million Euros. The project is coordinated by the Czech Metrology Institute and is divided into five working groups. This poster presents impact, excellence, relevance to EMPR objectives, and implementation and management of this project.(author)

Mathematical calibration procedure of a capacitive sensor-based indexed metrology platform

International Nuclear Information System (INIS)

Brau-Avila, A; Valenzuela-Galvan, M; Herrera-Jimenez, V M; Santolaria, J; Aguilar, J J; Acero, R

2017-01-01

The demand for faster and more reliable measuring tasks for the control and quality assurance of modern production systems has created new challenges for the field of coordinate metrology. Thus, the search for new solutions in coordinate metrology systems and the need for the development of existing ones still persists. One example of such a system is the portable coordinate measuring machine (PCMM), the use of which in industry has considerably increased in recent years, mostly due to its flexibility for accomplishing in-line measuring tasks as well as its reduced cost and operational advantages compared to traditional coordinate measuring machines. Nevertheless, PCMMs have a significant drawback derived from the techniques applied in the verification and optimization procedures of their kinematic parameters. These techniques are based on the capture of data with the measuring instrument from a calibrated gauge object, fixed successively in various positions so that most of the instrument measuring volume is covered, which results in time-consuming, tedious and expensive verification and optimization procedures. In this work the mathematical calibration procedure of a capacitive sensor-based indexed metrology platform (IMP) is presented. This calibration procedure is based on the readings and geometric features of six capacitive sensors and their targets with nanometer resolution. The final goal of the IMP calibration procedure is to optimize the geometric features of the capacitive sensors and their targets in order to use the optimized data in the verification procedures of PCMMs. (paper)

Mathematical calibration procedure of a capacitive sensor-based indexed metrology platform

Science.gov (United States)

Brau-Avila, A.; Santolaria, J.; Acero, R.; Valenzuela-Galvan, M.; Herrera-Jimenez, V. M.; Aguilar, J. J.

2017-03-01

The demand for faster and more reliable measuring tasks for the control and quality assurance of modern production systems has created new challenges for the field of coordinate metrology. Thus, the search for new solutions in coordinate metrology systems and the need for the development of existing ones still persists. One example of such a system is the portable coordinate measuring machine (PCMM), the use of which in industry has considerably increased in recent years, mostly due to its flexibility for accomplishing in-line measuring tasks as well as its reduced cost and operational advantages compared to traditional coordinate measuring machines. Nevertheless, PCMMs have a significant drawback derived from the techniques applied in the verification and optimization procedures of their kinematic parameters. These techniques are based on the capture of data with the measuring instrument from a calibrated gauge object, fixed successively in various positions so that most of the instrument measuring volume is covered, which results in time-consuming, tedious and expensive verification and optimization procedures. In this work the mathematical calibration procedure of a capacitive sensor-based indexed metrology platform (IMP) is presented. This calibration procedure is based on the readings and geometric features of six capacitive sensors and their targets with nanometer resolution. The final goal of the IMP calibration procedure is to optimize the geometric features of the capacitive sensors and their targets in order to use the optimized data in the verification procedures of PCMMs.

Reference metrology in a research fab: the NIST clean calibrations thrust

Science.gov (United States)

Dixson, Ronald; Fu, Joe; Orji, Ndubuisi; Renegar, Thomas; Zheng, Alan; Vorburger, Theodore; Hilton, Al; Cangemi, Marc; Chen, Lei; Hernandez, Mike; Hajdaj, Russell; Bishop, Michael; Cordes, Aaron

2009-03-01

In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) - a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab - a 1765 m2 (19,000 ft2) clean room with 743 m2 (8000 ft2) of class 100 space - is the anchor of this facility and an integral component of the new Center for Nanoscale Science and Technology (CNST) at NIST. Although the CNST/NanoFab is a nanotechnology research facility with a different strategic focus than a current high volume semiconductor fab, metrology tools still play an important role in the nanofabrication research conducted here. Some of the metrology tools available to users of the NanoFab include stylus profiling, scanning electron microscopy (SEM), and atomic force microscopy (AFM). Since 2001, NIST has collaborated with SEMATECH to implement a reference measurement system (RMS) using critical dimension atomic force microscopy (CD-AFM). NIST brought metrology expertise to the table and SEMATECH provided access to leading edge metrology tools in their clean room facility in Austin. Now, in the newly launched "clean calibrations" thrust at NIST, we are implementing the reference metrology paradigm on several tools in the CNST/NanoFab. Initially, we have focused on calibration, monitoring, and uncertainty analysis for a three-tool set consisting of a stylus profiler, an SEM, and an AFM. Our larger goal is the development of new and supplemental calibrations and standards that will benefit from the Class 100 environment available in the NanoFab and offering our customers calibration options that do not require exposing their samples to less clean environments. Toward this end, we have completed a preliminary evaluation of the performance of these instruments. The results of these evaluations suggest that the achievable uncertainties are generally consistent with our measurement goals.

Phase 1 Validation Testing and Simulation for the WEC-Sim Open Source Code

Science.gov (United States)

Ruehl, K.; Michelen, C.; Gunawan, B.; Bosma, B.; Simmons, A.; Lomonaco, P.

2015-12-01

WEC-Sim is an open source code to model wave energy converters performance in operational waves, developed by Sandia and NREL and funded by the US DOE. The code is a time-domain modeling tool developed in MATLAB/SIMULINK using the multibody dynamics solver SimMechanics, and solves the WEC's governing equations of motion using the Cummins time-domain impulse response formulation in 6 degrees of freedom. The WEC-Sim code has undergone verification through code-to-code comparisons; however validation of the code has been limited to publicly available experimental data sets. While these data sets provide preliminary code validation, the experimental tests were not explicitly designed for code validation, and as a result are limited in their ability to validate the full functionality of the WEC-Sim code. Therefore, dedicated physical model tests for WEC-Sim validation have been performed. This presentation provides an overview of the WEC-Sim validation experimental wave tank tests performed at the Oregon State University's Directional Wave Basin at Hinsdale Wave Research Laboratory. Phase 1 of experimental testing was focused on device characterization and completed in Fall 2015. Phase 2 is focused on WEC performance and scheduled for Winter 2015/2016. These experimental tests were designed explicitly to validate the performance of WEC-Sim code, and its new feature additions. Upon completion, the WEC-Sim validation data set will be made publicly available to the wave energy community. For the physical model test, a controllable model of a floating wave energy converter has been designed and constructed. The instrumentation includes state-of-the-art devices to measure pressure fields, motions in 6 DOF, multi-axial load cells, torque transducers, position transducers, and encoders. The model also incorporates a fully programmable Power-Take-Off system which can be used to generate or absorb wave energy. Numerical simulations of the experiments using WEC-Sim will be

SIP-Based Single Neuron Stochastic Predictive Control for Non-Gaussian Networked Control Systems with Uncertain Metrology Delays

Directory of Open Access Journals (Sweden)

Xinying Xu

2018-06-01

Full Text Available In this paper, a novel data-driven single neuron predictive control strategy is proposed for non-Gaussian networked control systems with metrology delays in the information theory framework. Firstly, survival information potential (SIP, instead of minimum entropy, is used to formulate the performance index to characterize the randomness of the considered systems, which is calculated by oversampling method. Then the minimum values can be computed by optimizing the SIP-based performance index. Finally, the proposed strategy, minimum entropy method and mean square error (MSE are applied to a networked motor control system, and results demonstrated the effectiveness of the proposed strategy.

SimCommSys: taking the errors out of error-correcting code simulations

Directory of Open Access Journals (Sweden)

Johann A. Briffa

2014-06-01

Full Text Available In this study, we present SimCommSys, a simulator of communication systems that we are releasing under an open source license. The core of the project is a set of C + + libraries defining communication system components and a distributed Monte Carlo simulator. Of principal interest is the error-control coding component, where various kinds of binary and non-binary codes are implemented, including turbo, LDPC, repeat-accumulate and Reed–Solomon. The project also contains a number of ready-to-build binaries implementing various stages of the communication system (such as the encoder and decoder, a complete simulator and a system benchmark. Finally, SimCommSys also provides a number of shell and python scripts to encapsulate routine use cases. As long as the required components are already available in SimCommSys, the user may simulate complete communication systems of their own design without any additional programming. The strict separation of development (needed only to implement new components and use (to simulate specific constructions encourages reproducibility of experimental work and reduces the likelihood of error. Following an overview of the framework, we provide some examples of how to use the framework, including the implementation of a simple codec, the specification of communication systems and their simulation.

Advanced metrology by offline SEM data processing

Science.gov (United States)

Lakcher, Amine; Schneider, Loïc.; Le-Gratiet, Bertrand; Ducoté, Julien; Farys, Vincent; Besacier, Maxime

2017-06-01

Today's technology nodes contain more and more complex designs bringing increasing challenges to chip manufacturing process steps. It is necessary to have an efficient metrology to assess process variability of these complex patterns and thus extract relevant data to generate process aware design rules and to improve OPC models. Today process variability is mostly addressed through the analysis of in-line monitoring features which are often designed to support robust measurements and as a consequence are not always very representative of critical design rules. CD-SEM is the main CD metrology technique used in chip manufacturing process but it is challenged when it comes to measure metrics like tip to tip, tip to line, areas or necking in high quantity and with robustness. CD-SEM images contain a lot of information that is not always used in metrology. Suppliers have provided tools that allow engineers to extract the SEM contours of their features and to convert them into a GDS. Contours can be seen as the signature of the shape as it contains all the dimensional data. Thus the methodology is to use the CD-SEM to take high quality images then generate SEM contours and create a data base out of them. Contours are used to feed an offline metrology tool that will process them to extract different metrics. It was shown in two previous papers that it is possible to perform complex measurements on hotspots at different process steps (lithography, etch, copper CMP) by using SEM contours with an in-house offline metrology tool. In the current paper, the methodology presented previously will be expanded to improve its robustness and combined with the use of phylogeny to classify the SEM images according to their geometrical proximities.

Development of laser materials processing and laser metrology techniques

International Nuclear Information System (INIS)

Kim, Cheol Jung; Chung, Chin Man; Kim, Jeong Mook; Kim, Min Suk; Kim, Kwang Suk; Baik, Sung Hoon; Kim, Seong Ouk; Park, Seung Kyu

1997-09-01

The applications of remote laser materials processing and metrology have been investigated in nuclear industry from the beginning of laser invention because they can reduce the risks of workers in the hostile environment by remote operation. The objective of this project is the development of laser material processing and metrology techniques for repairing and inspection to improve the safety of nuclear power plants. As to repairing, we developed our own laser sleeve welding head and innovative optical laser weld monitoring techniques to control the sleeve welding process. Furthermore, we designed and fabricated a 800 W Nd:YAG and a 150 W Excimer laser systems for high power laser materials processing in nuclear industry such as cladding and decontamination. As to inspection, we developed an ESPI and a laser triangulation 3-D profile measurement system for defect detection which can complement ECT and UT inspections. We also developed a scanning laser vibrometer for remote vibration measurement of large structures and tested its performance. (author). 58 refs., 16 tabs., 137 figs

Biochemical imaging of tissues by SIMS for biomedical applications

International Nuclear Information System (INIS)

Lee, Tae Geol; Park, Ji-Won; Shon, Hyun Kyong; Moon, Dae Won; Choi, Won Woo; Li, Kapsok; Chung, Jin Ho

2008-01-01

With the development of optimal surface cleaning techniques by cluster ion beam sputtering, certain applications of SIMS for analyzing cells and tissues have been actively investigated. For this report, we collaborated with bio-medical scientists to study bio-SIMS analyses of skin and cancer tissues for biomedical diagnostics. We pay close attention to the setting up of a routine procedure for preparing tissue specimens and treating the surface before obtaining the bio-SIMS data. Bio-SIMS was used to study two biosystems, skin tissues for understanding the effects of photoaging and colon cancer tissues for insight into the development of new cancer diagnostics for cancer. Time-of-flight SIMS imaging measurements were taken after surface cleaning with cluster ion bombardment by Bi n or C 60 under varying conditions. The imaging capability of bio-SIMS with a spatial resolution of a few microns combined with principal component analysis reveal biologically meaningful information, but the lack of high molecular weight peaks even with cluster ion bombardment was a problem. This, among other problems, shows that discourse with biologists and medical doctors are critical to glean any meaningful information from SIMS mass spectrometric and imaging data. For SIMS to be accepted as a routine, daily analysis tool in biomedical laboratories, various practical sample handling methodology such as surface matrix treatment, including nano-metal particles and metal coating, in addition to cluster sputtering, should be studied

Binding properties of SUMO-interacting motifs (SIMs) in yeast.

Science.gov (United States)

Jardin, Christophe; Horn, Anselm H C; Sticht, Heinrich

2015-03-01

Small ubiquitin-like modifier (SUMO) conjugation and interaction play an essential role in many cellular processes. A large number of yeast proteins is known to interact non-covalently with SUMO via short SUMO-interacting motifs (SIMs), but the structural details of this interaction are yet poorly characterized. In the present work, sequence analysis of a large dataset of 148 yeast SIMs revealed the existence of a hydrophobic core binding motif and a preference for acidic residues either within or adjacent to the core motif. Thus the sequence properties of yeast SIMs are highly similar to those described for human. Molecular dynamics simulations were performed to investigate the binding preferences for four representative SIM peptides differing in the number and distribution of acidic residues. Furthermore, the relative stability of two previously observed alternative binding orientations (parallel, antiparallel) was assessed. For all SIMs investigated, the antiparallel binding mode remained stable in the simulations and the SIMs were tightly bound via their hydrophobic core residues supplemented by polar interactions of the acidic residues. In contrary, the stability of the parallel binding mode is more dependent on the sequence features of the SIM motif like the number and position of acidic residues or the presence of additional adjacent interaction motifs. This information should be helpful to enhance the prediction of SIMs and their binding properties in different organisms to facilitate the reconstruction of the SUMO interactome.

Color and appearance metrology facility

Data.gov (United States)

Federal Laboratory Consortium — The NIST Physical Measurement Laboratory has established the color and appearance metrology facility to support calibration services for 0°/45° colored samples, 20°,...

Ionising radiation metrology : Physical basis for the radiation protection in Spain

International Nuclear Information System (INIS)

Arcos, J. M. los; Brosed, A.; Fernandez, F.

2004-01-01

Applying radiological protection principles and, in particular optimisation, requires a system of metrological references internationally traceable and to which be traced at the national level, through a well defined calibration chain. In this paper on overview of the activities done in the national standards laboratory and in the calibration laboratories existing in Spain is presented. As a conclusion it is established that, although the necessities at the protection level are reasonably covered for α, β, X and γ radiation, the lack of a neutronic reference laboratory is detected, to give metrological support to the two laboratories with capability for making irradiations or determinations of neutronic doses, currently operating in the country. (Author) 19 refs

Look@NanoSIMS--a tool for the analysis of nanoSIMS data in environmental microbiology.

Science.gov (United States)

Polerecky, Lubos; Adam, Birgit; Milucka, Jana; Musat, Niculina; Vagner, Tomas; Kuypers, Marcel M M

2012-04-01

We describe an open-source freeware programme for high throughput analysis of nanoSIMS (nanometre-scale secondary ion mass spectrometry) data. The programme implements basic data processing and analytical functions, including display and drift-corrected accumulation of scanned planes, interactive and semi-automated definition of regions of interest (ROIs), and export of the ROIs' elemental and isotopic composition in graphical and text-based formats. Additionally, the programme offers new functions that were custom-designed to address the needs of environmental microbiologists. Specifically, it allows manual and automated classification of ROIs based on the information that is derived either from the nanoSIMS dataset itself (e.g. from labelling achieved by halogen in situ hybridization) or is provided externally (e.g. as a fluorescence in situ hybridization image). Moreover, by implementing post-processing routines coupled to built-in statistical tools, the programme allows rapid synthesis and comparative analysis of results from many different datasets. After validation of the programme, we illustrate how these new processing and analytical functions increase flexibility, efficiency and depth of the nanoSIMS data analysis. Through its custom-made and open-source design, the programme provides an efficient, reliable and easily expandable tool that can help a growing community of environmental microbiologists and researchers from other disciplines process and analyse their nanoSIMS data. © 2012 Society for Applied Microbiology and Blackwell Publishing Ltd.

Utilization of the research and measurement reactor Braunschweig for neutron metrology

International Nuclear Information System (INIS)

Alberts, W.G.

1982-01-01

The objectives of the Physikalisch-Technische Bundesanstalt (PTB) with regard to neutron metrology are briefly described. The use of the PTB's Research and Measuring Reactor as neutron source for metrological purposes is discussed. Reference neutron beams are described which serve as irradiation facilities for the calibration of detectors for radiation protection purposes in the frame of the legal metrology work in the PTB. (orig.) [de

Metrological tests of a 200 L calibration source for HPGE detector systems for assay of radioactive waste drums

International Nuclear Information System (INIS)

Boshkova, T.; Mitev, K.

2016-01-01

In this work we present test procedures, approval criteria and results from two metrological inspections of a certified large volume "1"5"2Eu source (drum about 200 L) intended for calibration of HPGe gamma assay systems used for activity measurement of radioactive waste drums. The aim of the inspections was to prove the stability of the calibration source during its working life. The large volume source was designed and produced in 2007. It consists of 448 identical sealed radioactive sources (modules) apportioned in 32 transparent plastic tubes which were placed in a wooden matrix which filled the drum. During the inspections the modules were subjected to tests for verification of their certified characteristics. The results show a perfect compliance with the NIST basic guidelines for the properties of a radioactive certified reference material (CRM) and demonstrate the stability of the large volume CRM-drum after 7 years of operation. - Highlights: • Large (200 L) volume drum source designed, produced and certified as CRM in 2007. • Source contains 448 identical sealed radioactive "1"5"2Eu sources (modules). • Two metrological inspections in 2011 and 2014. • No statistically significant changes of the certified characteristics over time. • Stable calibration source for HPGe-gamma radioactive waste assay systems.

System for the measurement and detection of electric energy losses (SIM-IV); Sistema de medicion y deteccion de perdidas de energia electrica (SIM-IV)

Energy Technology Data Exchange (ETDEWEB)

Vidrio L, Gilberto; Gomez L, Martin J; Castan L, Roberto [Instituto de Investigaciones Electricas, Cuernavaca, Morelos (Mexico)

2004-07-01

The electric utility companies worldwide suffer, in greater or lesser degree, electrical energy losses. A great percentage of these losses is mostly due to illegal appropriations of energy. The consumers, by means of illicit practices such as clandestine connections and alteration of the operation of electricity meters, carry out the energy robbery. In order to try to alleviate the problematic of electric energy losses, in their majority by illicit, the electric utility companies have implemented one or more actions. Among the most important are: Visual inspection of the metering facilities. Its purpose is to verify the condition of the traditional protections of the metering installations, such as the seals and safety rings. Detection Equipment: These are recorders of energy consumption and of faults in conductors and are used to detect illicit connections and deviations in the consumption patterns and to the electrical energy connection or to the secondary distribution network. Statistical analysis of consumption: Many electric facility companies have adapted their processing consumption reading systems to detect deviations in the of consumption patterns of their clients. This could correspond to abnormal situations. Since this country is not extraneous to the problematic of energy losses, in the Instituto de Investigaciones Electricas it was developed a System of Measurement and Detection of Losses of Electrical Energy (SIM-IV) as a result of the knowledge of the problematic obtained from the projects in the metering area and of the interaction through work meetings with personnel of the Comision Federal de Electricidad and of Luz y Fuerza del Centro (LyFC), in which concepts of advanced technology were applied for the measurement of electrical variables. The SIM-IV is a system oriented to the metering of consumption and the detection of robberies of electrical energy caused by clandestine connections and non-allowed interventions to the energy meters. Since

System for the measurement and detection of electric energy losses (SIM-IV); Sistema de medicion y deteccion de perdidas de energia electrica (SIM-IV)

Energy Technology Data Exchange (ETDEWEB)

Vidrio L, Gilberto; Gomez L, Martin J; Castan L, Roberto [Instituto de Investigaciones Electricas, Cuernavaca, Morelos (Mexico)

2004-07-01

The electric utility companies worldwide suffer, in greater or lesser degree, electrical energy losses. A great percentage of these losses is mostly due to illegal appropriations of energy. The consumers, by means of illicit practices such as clandestine connections and alteration of the operation of electricity meters, carry out the energy robbery. In order to try to alleviate the problematic of electric energy losses, in their majority by illicit, the electric utility companies have implemented one or more actions. Among the most important are: Visual inspection of the metering facilities. Its purpose is to verify the condition of the traditional protections of the metering installations, such as the seals and safety rings. Detection Equipment: These are recorders of energy consumption and of faults in conductors and are used to detect illicit connections and deviations in the consumption patterns and to the electrical energy connection or to the secondary distribution network. Statistical analysis of consumption: Many electric facility companies have adapted their processing consumption reading systems to detect deviations in the of consumption patterns of their clients. This could correspond to abnormal situations. Since this country is not extraneous to the problematic of energy losses, in the Instituto de Investigaciones Electricas it was developed a System of Measurement and Detection of Losses of Electrical Energy (SIM-IV) as a result of the knowledge of the problematic obtained from the projects in the metering area and of the interaction through work meetings with personnel of the Comision Federal de Electricidad and of Luz y Fuerza del Centro (LyFC), in which concepts of advanced technology were applied for the measurement of electrical variables. The SIM-IV is a system oriented to the metering of consumption and the detection of robberies of electrical energy caused by clandestine connections and non-allowed interventions to the energy meters. Since

Installation of a shielded SIMS in CEA Cadarache

International Nuclear Information System (INIS)

Desgranges, L.; Pasquet, B.; Rasser, B.

2002-01-01

A shielded SIMS 6f has been installed in the LECA in 1999 and will examine nuclear fuels before the end of this year. Meanwhile several studies have been realised to test its technical performance for nuclear materials analysis. After a brief presentation of the design of the shielded SIMS, five examples of preliminary results will be underlined. In the nuclear field, SIMS is currently used for the analysis of Zircaloy cladding corrosion because it can detect light elements like boron or lithium. More than a quantitative measurement of isotopes, it was possible with our SIMS to produce a two dimension image of the corrosion layer focusing on the protective layer. SIMS has also the advantage to detect isotopes with a low concentration. This property will be enlightened with some results obtained on sulphur in UO 2 . Because SIMS uses the erosion of the sample surface, it is possible to make depth profile. This possibility will be demonstrated on water altered glass samples on which the altered layer will be evidenced on depth profile. The last application of SIMS presented in the paper is addressed to nuclear fuel with detection of xenon. Fission gases release is indeed of first importance for nuclear fuel because it affects fuel swelling, rod internal pressure, fuel thermal conductivity via the formation of pores etc. We have demonstrated that it was possible to measure xenon on an unirradiated UO 2 sample implanted with xenon. It was also proved that xenon could be measured in gaseous state, which would make possible the measurement of xenon filling pores. (author)

Slovak Institute of Metrology. Annual Report 2001

International Nuclear Information System (INIS)

Bily, M.

2002-03-01

A brief account of activities carried out by the Slovak Institute of Metrology (SMU) in 2001 is presented. These activities are reported under the headings: (1) Organisation identification; (2) Mission and medium-term perspectives; (3) Contract with Slovak Office of Standards, Metrology and Testing of the Slovak Republic; (4) SMU activities ; (5) Economic results; (6) Personnel management; (7) Aims and results of their fulfilment; (8) Evaluation and analysis of SMU development in 2001; (9) Main group of outputs users; (10) Conclusion

Objectives and functions of ionizing radiation metrology

International Nuclear Information System (INIS)

Rothe, H.

1981-01-01

Proceeding from the fundamental objectives of ionizing radiation metrology, the main tasks of metrological research and assurances of accurate measurements in dosimetry and activity determination are summarized. With a view to the technical performance of these tasks the state-of-the-art and the trends in reproduction and dissemination of dosimetric and activity units are outlined. Problems are derived that should be solved within the framework of the CMEA Standing Commissions on Standardization and on the Peaceful Uses of Atomic Energy. (author)

MI-Sim: A MATLAB package for the numerical analysis of microbial ecological interactions.

Directory of Open Access Journals (Sweden)

Matthew J Wade

Full Text Available Food-webs and other classes of ecological network motifs, are a means of describing feeding relationships between consumers and producers in an ecosystem. They have application across scales where they differ only in the underlying characteristics of the organisms and substrates describing the system. Mathematical modelling, using mechanistic approaches to describe the dynamic behaviour and properties of the system through sets of ordinary differential equations, has been used extensively in ecology. Models allow simulation of the dynamics of the various motifs and their numerical analysis provides a greater understanding of the interplay between the system components and their intrinsic properties. We have developed the MI-Sim software for use with MATLAB to allow a rigorous and rapid numerical analysis of several common ecological motifs. MI-Sim contains a series of the most commonly used motifs such as cooperation, competition and predation. It does not require detailed knowledge of mathematical analytical techniques and is offered as a single graphical user interface containing all input and output options. The tools available in the current version of MI-Sim include model simulation, steady-state existence and stability analysis, and basin of attraction analysis. The software includes seven ecological interaction motifs and seven growth function models. Unlike other system analysis tools, MI-Sim is designed as a simple and user-friendly tool specific to ecological population type models, allowing for rapid assessment of their dynamical and behavioural properties.

MI-Sim: A MATLAB package for the numerical analysis of microbial ecological interactions.

Science.gov (United States)

Wade, Matthew J; Oakley, Jordan; Harbisher, Sophie; Parker, Nicholas G; Dolfing, Jan

2017-01-01

Food-webs and other classes of ecological network motifs, are a means of describing feeding relationships between consumers and producers in an ecosystem. They have application across scales where they differ only in the underlying characteristics of the organisms and substrates describing the system. Mathematical modelling, using mechanistic approaches to describe the dynamic behaviour and properties of the system through sets of ordinary differential equations, has been used extensively in ecology. Models allow simulation of the dynamics of the various motifs and their numerical analysis provides a greater understanding of the interplay between the system components and their intrinsic properties. We have developed the MI-Sim software for use with MATLAB to allow a rigorous and rapid numerical analysis of several common ecological motifs. MI-Sim contains a series of the most commonly used motifs such as cooperation, competition and predation. It does not require detailed knowledge of mathematical analytical techniques and is offered as a single graphical user interface containing all input and output options. The tools available in the current version of MI-Sim include model simulation, steady-state existence and stability analysis, and basin of attraction analysis. The software includes seven ecological interaction motifs and seven growth function models. Unlike other system analysis tools, MI-Sim is designed as a simple and user-friendly tool specific to ecological population type models, allowing for rapid assessment of their dynamical and behavioural properties.

IT Security Standards and Legal Metrology - Transfer and Validation

Science.gov (United States)

Thiel, F.; Hartmann, V.; Grottker, U.; Richter, D.

2014-08-01

Legal Metrology's requirements can be transferred into the IT security domain applying a generic set of standardized rules provided by the Common Criteria (ISO/IEC 15408). We will outline the transfer and cross validation of such an approach. As an example serves the integration of Legal Metrology's requirements into a recently developed Common Criteria based Protection Profile for a Smart Meter Gateway designed under the leadership of the Germany's Federal Office for Information Security. The requirements on utility meters laid down in the Measuring Instruments Directive (MID) are incorporated. A verification approach to check for meeting Legal Metrology's requirements by their interpretation through Common Criteria's generic requirements is also presented.

Development of safety assessment model based on TRU-2 report using GoldSim

International Nuclear Information System (INIS)

Ebina, Takanori; Inagaki, Manabu; Kato, Tomoko

2011-03-01

The safety assessment model at 'Second Progress Report on Research and Development for TRU Waste Disposal in Japan'(TRU-2 report) was designed using the numerical code TIGER, that allows the physical and chemical properties within the system to vary with time. In the future, at the examination to optimize nuclear fuel cycle for geological disposal, it is expected that the analysis that has many cases like sensitivity analysis and uncertainty analysis are in demand. The numerical code TIGER is a calculation code that analyze engineered barrier system and geological barrier system, and its numerical model is verified with nuclide migration code for engineered barrier system MESHNOTE, and nuclide migration code for geosphere MATRICS. At the analysis using TIGER, the migration (i.e. Engineered barrier system, Host rock and Fault) have to be analysed independently at each region, consequently the huge number of complicated parameter setting have been required. On the other hand, by using numerical code GoldSim, all regions are analyzed synchronously and parameters can be defined at same model. So it makes quality control of parameters easier. Furthermore, analysis time by GoldSim is shorter than TIGER and GoldSim can calculate many number of Monte Carlo simulations among multiple computers. In future, Safety Analyses of TRU waste package disposal will be carried out according as study of an optimization of nuclear fuel cycle. Therefor, safety assessment model for TRU waste disposal using GoldSim was designed, and calculation results were verified by comparing with the result of TRU-2 report. (author)

A Look at the U.S. Energy System – A Strategic Impact Model (2050 SIM)

Energy Technology Data Exchange (ETDEWEB)

Layne Pincock; John W. Collins

2011-06-01

The United States (U.S.) energy infrastructure is among the most reliable, accessible, and economical in the world. On the other hand, it is also excessively reliant on foreign energy sources, experiences high volatility in energy prices, does not always practice good stewardship of finite indigenous energy resources, and emits significant quantities of greenhouse gases. The U.S. Department of Energy is conducting research and development on advanced nuclear reactor concepts and technologies, including High Temperature Gas Reactor (HTGR) technologies, directed at helping the United States meet its current and future energy challenges. This paper discusses the systematic approach used to develop the 2050 Strategic Impact Model (2050 SIM), which allows the user to analyze and depict the benefits of various energy sources in meeting the energy demand. It also provides an overall systems understanding of the tradeoffs between building and using HTGRs versus other existing technologies for providing energy (heat and electricity) to various energy-use sectors in the United States. This paper also provides the assumptions used in the model, the rational for the methodology, and the references for the source documentation and source data used in developing 2050 SIM.

Joint Research on Scatterometry and AFM Wafer Metrology

OpenAIRE

Bodermann, B.; Buhr, E.; Danzebrink, H.U.; Bär, M.; Scholze, F.; Krumrey, M.; Wurm, M.; Klapetek, P.; Hansen, P.E.; Korpelainen, V.; Van Veghel, M.; Yacoot, A.; Siitonen, S.; El Gawhary, O.; Burger, S.

2011-01-01

Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both experimental and modelling methods will be enhanced and different methods will be compared with each other and with specially adapted atomic force microscopy (AFM) and scanning electron microscopy (SEM) m...

What metrology can do to improve the quality of your atmospheric ammonia measurements

Science.gov (United States)

Leuenberger, Daiana; Martin, Nicholas A.; Pascale, Céline; Guillevic, Myriam; Ackermann, Andreas; Ferracci, Valerio; Cassidy, Nathan; Hook, Josh; Battersby, Ross M.; Tang, Yuk S.; Stevens, Amy C. M.; Jones, Matthew R.; Braban, Christine F.; Gates, Linda; Hangartner, Markus; Sacco, Paolo; Pagani, Diego; Hoffnagle, John A.; Niederhauser, Bernhard

2017-04-01

dependant permeation of a pure substance through a membrane into a stream of pre-purified matrix gas and subsequent dilution to required amount fractions. All relevant parameters are fully traceable to SI-units. Extractive optical analysers can be connected directly to both, stationary and mobile systems for calibration. Moreover, the resulting gas mixture can also be pressurised into coated cylinders by cryo-filling. The mobile system as well as these cylinders can be applied for calibrations of optical instruments in other laboratories and in the field. In addition, an SI-traceable dilution system based on a cascade of critical orifices has been established to dilute NH3 mixtures in the order of μmol/mol stored in cylinders. It is planned to apply this system to calibrate and re-sample gas mixtures in cylinders due to its very economical gas use. Here we present insights into the development of said infrastructure and results performance tests. Moreover, we include results of the study on adsorption/desorption effects in dry as well as humidified matrix gas into the discussion on the generation of reference gas mixtures. Acknowledgement: This work was supported by the European Metrology Research Programme (EMRP). The EMRP is jointly funded by the EMRP participating countries within EURAMET and the European Union.

Development of GoldSim Program Template for Safety Assessment of an LILW Disposal

International Nuclear Information System (INIS)

Lee, Youn Myoung; Jeong, Jong Tae

2010-08-01

A modeling study and development of a methodology, by which an assessment of safety and performance for a low- and intermediate level radioactive waste (LILW) repository could be effectively made has been carried out. With normal or abnormal nuclide release cases associated with the various FEPs and scenarios involved in the performance of the proposed repository in view of nuclide transport and transfer both in geosphere and biosphere, a total system performance assessment (TSPA) program has been developed by utilizing a commercial development tool program, GoldSim. The report especially deals much with a detailed conceptual modeling scheme by which a GoldSim program modules, all of which are integrated into a TSPA program template were able to be developed. Degradation effects of the near-field such manmade barriers as waste container and the silo on the performance of the repository are also modeled and quantitatively and deterministically/probabilistically evaluated with input data set currently available or assumed. In-depth system models that are conceptually and rather practically described and then ready for implementing into a GoldSim TSPA program are introduced with illustrations. The GoldSim TSPA template program developed through this study is expected to be successfully applied to the post closure safety assessment required for an LILW repository such as Gyeongju repository

Advances in speckle metrology and related techniques

CERN Document Server

Kaufmann, Guillermo H

2010-01-01

Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the l

A Conceptual Modeling for a GoldSim Program for Safety Assessment of an LILW Repository

International Nuclear Information System (INIS)

Lee, Youn Myoung; Hwang, Yong Soo; Kang, Chul Hyung; Lee, Sung Ho

2009-12-01

Modeling study and development of a total system performance assessment (TSPA) program, by which an assessment of safety and performance for a low- and intermediate-level radioactive waste disposal repository with normal or abnormal nuclide release cases associated with the various FEPs involved in the performance of the proposed repository could be made has been carrying out by utilizing GoldSim under contract with KRMC. The report deals with a detailed conceptual modeling scheme by which a GoldSim program modules, all of which are integrated into a TSPA program as well as the input data set currently available. In-depth system models that are conceptually and rather practically described and then ready for implementing into a GoldSim program are introduced with plenty of illustrative conceptual models and sketches. The GoldSim program that will be finally developed through this project is expected to be successfully applied to the post closure safety assessment required both for the LILW repository and pyro processed repository by the regulatory body with both increased practicality and much reduced uncertainty

Coherent double-color interference microscope for traceable optical surface metrology

Science.gov (United States)

Malinovski, I.; França, R. S.; Bessa, M. S.; Silva, C. R.; Couceiro, I. B.

2016-06-01

Interference microscopy is an important field of dimensional surface metrology because it provides direct traceability of the measurements to the SI base unit definition of the metre. With a typical measurement range from micrometres to nanometres interference microscopy (IM) covers the gap between classic metrology and nanometrology, providing continuous transfer of dimensional metrology into new areas of nanoscience and nanotechnology. Therefore IM is considered to be an indispensable tool for traceable transfer of the metre unit to different instruments. We report here the metrological study of an absolute Linnik interference microscope (IM) based on two frequency stabilized lasers. The design permits the flexible use of both lasers for measurements depending on the demand of the concrete measurement task. By principle of operation IM is combination of imaging and phase-shifting interferometry (PSI). The traceability is provided by the wavelength reference, that is, a He-Ne 633 nm stabilized laser. The second laser source, that is, a Blue-Green 488 nm grating stabilized laser diode, is used for improvements of resolution, and also for resolving integer fringe discontinuities on sharp features of the surface. The IM was optimized for surface height metrology. We have performed the study of the systematic effects of the measurements. This study allowed us to improve the hardware and software of IM and to find corrections for main systematic errors. The IM is purposed for 1D to 3D height metrology and surface topography in an extended range from nanometres to micrometres. The advantages and disadvantages of the design and developed methods are discussed.

Coherent double-color interference microscope for traceable optical surface metrology

International Nuclear Information System (INIS)

Malinovski, I; França, R S; Bessa, M S; Silva, C R; Couceiro, I B

2016-01-01

Interference microscopy is an important field of dimensional surface metrology because it provides direct traceability of the measurements to the SI base unit definition of the metre. With a typical measurement range from micrometres to nanometres interference microscopy (IM) covers the gap between classic metrology and nanometrology, providing continuous transfer of dimensional metrology into new areas of nanoscience and nanotechnology. Therefore IM is considered to be an indispensable tool for traceable transfer of the metre unit to different instruments. We report here the metrological study of an absolute Linnik interference microscope (IM) based on two frequency stabilized lasers. The design permits the flexible use of both lasers for measurements depending on the demand of the concrete measurement task. By principle of operation IM is combination of imaging and phase-shifting interferometry (PSI). The traceability is provided by the wavelength reference, that is, a He-Ne 633 nm stabilized laser. The second laser source, that is, a Blue-Green 488 nm grating stabilized laser diode, is used for improvements of resolution, and also for resolving integer fringe discontinuities on sharp features of the surface. The IM was optimized for surface height metrology. We have performed the study of the systematic effects of the measurements. This study allowed us to improve the hardware and software of IM and to find corrections for main systematic errors. The IM is purposed for 1D to 3D height metrology and surface topography in an extended range from nanometres to micrometres. The advantages and disadvantages of the design and developed methods are discussed. (paper)

[The EFS metrology: From the production to the reason].

Science.gov (United States)

Reifenberg, J-M; Riout, E; Leroy, A; Begue, S

2014-06-01

In order to answer statutory requirements and to anticipate the future needs and standards, the EFS is committed, since a few years, in a process of harmonization of its metrology function. In particular, the institution has opted for the skills development by internalizing the metrological traceability of the main critical quantities (temperature, volumetric) measurements. The development of metrology so resulted in a significant increase in calibration and testing activities. Methods are homogenized and improved through accreditations. The investment strategies are based on more and more demanding specifications. The performance of the equipments is better known and mastered. Technical expertise and maturity of the national metrology function today are assets to review in more informed ways the appropriateness of the applied periodicities. Analysis of numerous information and data in the calibration and testing reports could be pooled and operated on behalf of the unique establishment. The objective of this article is to illustrate these reflections with a few examples from of a feedback of the EFS Pyrénées Méditerranée. The analysis of some methods of qualification, the exploitation of the historical metrology in order to quantify the risk of non-compliance, and to adapt the control strategy, analysis of the criticality of an instrument in a measurement process, risk analyses are tools that deserve to be more widely exploited for that discipline wins in efficiency at the national level. Copyright © 2014 Elsevier Masson SAS. All rights reserved.

Comparison of asphere measurements by tactile and optical metrological instruments

NARCIS (Netherlands)

Bergmans, R.H.; Nieuwenkamp, H.J.; Kok, G.J.P.; Blobel, G.; Nouira, H.; Küng, A.; Baas, M.; Voert, M.J.A. te; Baer, G.; Stuerwald, S.

2015-01-01

A comparison of topography measurements of aspherical surfaces was carried out by European metrology institutes, other research institutes and a company as part of an European metrology research project. In this paper the results of this comparison are presented. Two artefacts were circulated, a

SimNEC : research platform for studying human functioning in NCW

NARCIS (Netherlands)

Veen, H.A.H.C. van; Graaf, B. de; Essens, P.

2006-01-01

SimNEC is TNOÆs grand scheme for experimentally studying human factors issues related to NEC/NCW. The research platform SimNEC consists of multidisciplinary expert teams, long-term research programmes, and a local network of state-of-the-art simulator modules. SimNEC does not focus on technology,

X-ray pulse wavefront metrology using speckle tracking

International Nuclear Information System (INIS)

Berujon, Sebastien; Ziegler, Eric; Cloetens, Peter

2015-01-01

The theoretical description and experimental implementation of a speckle-tracking-based instrument which permits the characterisation of X-ray pulse wavefronts. An instrument allowing the quantitative analysis of X-ray pulsed wavefronts is presented and its processing method explained. The system relies on the X-ray speckle tracking principle to accurately measure the phase gradient of the X-ray beam from which beam optical aberrations can be deduced. The key component of this instrument, a semi-transparent scintillator emitting visible light while transmitting X-rays, allows simultaneous recording of two speckle images at two different propagation distances from the X-ray source. The speckle tracking procedure for a reference-less metrology mode is described with a detailed account on the advanced processing schemes used. A method to characterize and compensate for the imaging detector distortion, whose principle is also based on speckle, is included. The presented instrument is expected to find interest at synchrotrons and at the new X-ray free-electron laser sources under development worldwide where successful exploitation of beams relies on the availability of an accurate wavefront metrology

Determination of the elementary charge and the quantum metrological triangle experiment

Energy Technology Data Exchange (ETDEWEB)

Feltin, N.; Piquemal, F. [Laboratoire National de Metrologie et d' Essais (LNE), 78 - Trappes (France)

2009-06-15

The elementary charge e is of fundamental importance in physics. The determination of its value, which is closely linked to progress of the measurement techniques, started in the beginning of the twentieth century and is still on-going. Today, in the frame of the CODATA adjustment, the evaluation of the fundamental constant, e, is derived from a complex calculation and is no more related to a single experiment. But the development of single electron tunneling (SET) devices, started in the early nineties, has opened the path towards modern metrological systems as quantum current sources. Thus a new direct determination of e is possible by implementing an electron pump and the set-up of the quantum metrological triangle (QMT) in combination with the experiments linking mechanical and electrical units. Furthermore, we show how the QMT experiment can contribute to the establishment of a new system of units based on fundamental constants of physics. (authors)

Magnetic nanoparticles. Metrological aspects

International Nuclear Information System (INIS)

Nikiforov, V N; Nikiforov, A V; Oxengendler, B L; Turaeva, N N; Sredin, V G

2011-01-01

The experiments on influence of the iron oxide cluster size on the specific magnetic moment are performed. Both free and covered clusters are investigated. The experiments are interpreted on the base of core-shell model by analogy to Weizsaecker formula in the nuclear physics. Metrological parameters for the cluster size investigation are obtained.

TSOM method for semiconductor metrology

Science.gov (United States)

Attota, Ravikiran; Dixson, Ronald G.; Kramar, John A.; Potzick, James E.; Vladár, András E.; Bunday, Benjamin; Novak, Erik; Rudack, Andrew

2011-03-01

Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry, scanning electron microscopy (SEM), and atomic force microscopy (AFM). TSOM can be used in both reflection and transmission modes and is applicable to a variety of target materials and shapes. Nanometrology applications that have been demonstrated by experiments or simulations include defect analysis, inspection and process control; critical dimension, photomask, overlay, nanoparticle, thin film, and 3D interconnect metrologies; line-edge roughness measurements; and nanoscale movements of parts in MEMS/NEMS. Industries that could benefit include semiconductor, data storage, photonics, biotechnology, and nanomanufacturing. TSOM is relatively simple and inexpensive, has a high throughput, and provides nanoscale sensitivity for 3D measurements with potentially significant savings and yield improvements in manufacturing.

Clean focus, dose and CD metrology for CD uniformity improvement

Science.gov (United States)

Lee, Honggoo; Han, Sangjun; Hong, Minhyung; Kim, Seungyoung; Lee, Jieun; Lee, DongYoung; Oh, Eungryong; Choi, Ahlin; Kim, Nakyoon; Robinson, John C.; Mengel, Markus; Pablo, Rovira; Yoo, Sungchul; Getin, Raphael; Choi, Dongsub; Jeon, Sanghuck

2018-03-01

Lithography process control solutions require more exacting capabilities as the semiconductor industry goes forward to the 1x nm node DRAM device manufacturing. In order to continue scaling down the device feature sizes, critical dimension (CD) uniformity requires continuous improvement to meet the required CD error budget. In this study we investigate using optical measurement technology to improve over CD-SEM methods in focus, dose, and CD. One of the key challenges is measuring scanner focus of device patterns. There are focus measurement methods based on specially designed marks on scribe-line, however, one issue of this approach is that it will report focus of scribe line which is potentially different from that of the real device pattern. In addition, scribe-line marks require additional design and troubleshooting steps that add complexity. In this study, we investigated focus measurement directly on the device pattern. Dose control is typically based on using the linear correlation behavior between dose and CD. The noise of CD measurement, based on CD-SEM for example, will not only impact the accuracy, but also will make it difficult to monitor dose signature on product wafers. In this study we will report the direct dose metrology result using an optical metrology system which especially enhances the DUV spectral coverage to improve the signal to noise ratio. CD-SEM is often used to measure CD after the lithography step. This measurement approach has the advantage of easy recipe setup as well as the flexibility to measure critical feature dimensions, however, we observe that CD-SEM metrology has limitations. In this study, we demonstrate within-field CD uniformity improvement through the extraction of clean scanner slit and scan CD behavior by using optical metrology.

System for automatic gauge block length measurement optimized for secondary length metrology

Czech Academy of Sciences Publication Activity Database

Buchta, Zdeněk; Šarbort, Martin; Čížek, Martin; Hucl, Václav; Řeřucha, Šimon; Pikálek, Tomáš; Dvořáčková, Š.; Dvořáček, F.; Kůr, J.; Konečný, P.; Weigl, M.; Lazar, Josef; Číp, Ondřej

2017-01-01

Roč. 49, JULY (2017), s. 322-331 ISSN 0141-6359 R&D Projects: GA TA ČR(CZ) TA03010663; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01 Institutional support: RVO:68081731 Keywords : low-coherence interferometry * laser interferometry * Gauge block * metrology Subject RIV: BH - Optics, Masers, Laser s OBOR OECD: Optics (including laser optics and quantum optics) Impact factor: 2.237, year: 2016

Neutron metrology in the HFR

International Nuclear Information System (INIS)

Kraakman, R.; Voorbraak, W.P.

1993-04-01

Additional to the in-core EXOTIC experiments, six irradiations of ceramic material, R212-001 to R212-006, have been performed in the PSF of the HFR. This note presents the neutron metrology results for these irradiations. (orig.)

Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolution

International Nuclear Information System (INIS)

Chandra, Subhash

2008-01-01

provided a rule-of-thumb criterion for the validation of sample preparation. The fractured freeze-dried cells allowed 3-D SIMS imaging and localization of 13 C 15 N labeled molecules and therapeutic drugs containing an elemental tag. Examples are shown to demonstrate that both diffusible elements and molecules are prone to artifact-induced relocation at subcellular scale if the sample preparation is compromised. The sample preparation is problem dependent and may vary widely between the diverse sample types of biological systems and the type of instrument used for SIMS analysis. The sample preparation, however, must be validated so that SIMS can be applied with confidence in biology and medicine

Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolution

Science.gov (United States)

Chandra, Subhash

2008-12-01

provided a rule-of-thumb criterion for the validation of sample preparation. The fractured freeze-dried cells allowed 3-D SIMS imaging and localization of 13C 15N labeled molecules and therapeutic drugs containing an elemental tag. Examples are shown to demonstrate that both diffusible elements and molecules are prone to artifact-induced relocation at subcellular scale if the sample preparation is compromised. The sample preparation is problem dependent and may vary widely between the diverse sample types of biological systems and the type of instrument used for SIMS analysis. The sample preparation, however, must be validated so that SIMS can be applied with confidence in biology and medicine.

Quantitative analysis of styrene butadiene copolymers using S-SIMS and LA-FTICRMS

International Nuclear Information System (INIS)

Ruch, D.; Boes, C.; Zimmer, R.; Muller, J.F.; Migeon, H.-N.

2003-01-01

Styrene butadiene copolymers (SBR) have been analyzed by static secondary ion mass spectrometry (S-SIMS) and laser ablation Fourier transform ion cyclotron resonance mass spectrometry (LA-FTICRMS) to obtain quantitative information based on specific peaks knowing that the complication of this system is that there are no characteristic SIMS peaks unique to each styrene and butadiene monomer. So, to overcome this problem, a silver deposition has been applied into polystyrene (PS), butadiene rubber (BR) and SBR. By this way, new secondary ions are detected in particular silver cationized butadiene and styrene monomers at m/z 161/163 and 211/213, respectively. The LA-FTICRMS experiments do not require pre-treatment. At high laser power density, UV photons (193, 266 and 355 nm) allow to detect directly the styrene and butadiene ions at m/z 104 and 54, respectively. Using these SIMS and LA-FTICRMS peaks, it is possible to obtain quantitative results. However, the silver coating in the SIMS experiment seems to have a great influence on the obtention of quantitative information. For LA-FTICRMS experiments, the best results seem to be obtained at the 355 nm wavelength

Research on the SIM card implementing functions of transport card

Science.gov (United States)

Li, Yi; Wang, Lin

2015-12-01

This paper is based on the analysis for theory and key technologies of contact communication, contactless communication card and STK menu, and proposes complete software and hardware solution for achieving convenience and secure mobile payment system on SIM card.

Parametric boundary reconstruction algorithm for industrial CT metrology application.

Science.gov (United States)

Yin, Zhye; Khare, Kedar; De Man, Bruno

2009-01-01

High-energy X-ray computed tomography (CT) systems have been recently used to produce high-resolution images in various nondestructive testing and evaluation (NDT/NDE) applications. The accuracy of the dimensional information extracted from CT images is rapidly approaching the accuracy achieved with a coordinate measuring machine (CMM), the conventional approach to acquire the metrology information directly. On the other hand, CT systems generate the sinogram which is transformed mathematically to the pixel-based images. The dimensional information of the scanned object is extracted later by performing edge detection on reconstructed CT images. The dimensional accuracy of this approach is limited by the grid size of the pixel-based representation of CT images since the edge detection is performed on the pixel grid. Moreover, reconstructed CT images usually display various artifacts due to the underlying physical process and resulting object boundaries from the edge detection fail to represent the true boundaries of the scanned object. In this paper, a novel algorithm to reconstruct the boundaries of an object with uniform material composition and uniform density is presented. There are three major benefits in the proposed approach. First, since the boundary parameters are reconstructed instead of image pixels, the complexity of the reconstruction algorithm is significantly reduced. The iterative approach, which can be computationally intensive, will be practical with the parametric boundary reconstruction. Second, the object of interest in metrology can be represented more directly and accurately by the boundary parameters instead of the image pixels. By eliminating the extra edge detection step, the overall dimensional accuracy and process time can be improved. Third, since the parametric reconstruction approach shares the boundary representation with other conventional metrology modalities such as CMM, boundary information from other modalities can be directly

Sim-based detection tools to minimize motorcycle theft

Science.gov (United States)

Triansyah, F. A.; Mudhafar, Z.; Lestari, C.; Amilia, S.; Ruswana, N. D.; Junaeti, E.

2018-05-01

The number of motorcycles in Indonesia spurs the increased criminal acts of motorcycle theft. In addition, the number of motorcycles increases the number of traffic accidents caused by improper motorists. The purpose of this research is to make METEOR (SIM Detector) which is a tool to detect the feasibility of SIM (driver license) which is used to operate and protect motorcycle against theft. METEOR is made through the assembly, encoding, testing, and sequencing stages of the motorcycle. Based on the research that has been done, METEOR generated that can detect the SIM by using additional RFID chip and can be set on the motorcycle. Without the proper SIM, motorized chests coupled with METEOR cannot be turned on. So it can be concluded that motorcycles with additional METEOR is able to be a safety device against theft and as a tool to test the feasibility of motorcycle riders.

The eponymous Dr James Marion Sims MD, LLD (1813-1883).

Science.gov (United States)

West, M J; Irvine, L M

2015-02-01

Dr James Marion Sims was born in 1813 in Lancaster County, South Carolina. It was while pioneering numerous surgical procedures in Alabama that in 1849 he achieved the outstanding landmark in medical history of successfully, and consistently, repairing vesicovaginal fistulae. Sims soon developed a reputation as a fine surgeon, with new operations and techniques, using novel surgical instruments and his innovative approaches frequently published. Moving to New York City in 1853, he further established hospitals devoted entirely to women's health. Sims was controversial, with flamboyant descriptions of self-confident success, yet they were tempered with sober reflection of failure and loss. Today we remain with the Sims speculum and Sims position, eponymous tributes to his accomplishments as the 'Father of Gynaecology'. © The Author(s) 2013 Reprints and permissions: sagepub.co.uk/journalsPermissions.nav.

Interrogating Host-virus Interactions and Elemental Transfer Using NanoSIMS

Science.gov (United States)

Pasulka, A.; Thamatrakoln, K.; Poulos, B.; Bidle, K. D.; Sullivan, M. B.; Orphan, V. J.

2016-02-01

Marine viruses (bacteriophage and eukaryotic viruses) impact microbial food webs by influencing microbial community structure, carbon and nutrient flow, and serving as agents of gene transfer. While the collective impact of viral activity has become more apparent over the last decade, there is a growing need for single-cell and single-virus level measurements of the associated carbon and nitrogen transfer, which ultimately shape the biogeochemical impact of viruses in the upper ocean. Stable isotopes have been used extensively for understanding trophic relationships and elemental cycling in marine food webs. While single-cell isotope approaches such as nanoscale secondary ion mass spectrometry (nanoSIMS) have been more readily used to study trophic interactions between microorganisms, isotopic enrichment in viruses has not been described. Here we used nanoSIMS to quantify the transfer of stable isotopes (13C and 15N) from host to individual viral particles in two distinct unicellular algal-virus model systems. These model systems represent a eukaryotic phytoplankton (Emiliania huxleyi strain CCMP374) and its 200nm coccolithovirus (EhV207), as well as a cyanobacterial phytoplankton (Synechococcus WH8101) and its 80nm virus (Syn1). Host cells were grown on labeled media for multiple generations, subjected to viral infection, and then viruses were harvested after lysis. In both cases, nanoSIMS measurements were able to detect 13C and 15N in the resulting viral particles significantly above the background noise. The isotopic enrichment in the viral particles mirrored that of the host. Through use of these laboratory model systems, we quantified the sensitivity (ion counts), spatial resolution, and reproducibility, including sources of methodological and biological variability, in stable isotope incorporation into viral particles. Our findings suggest that nanoSIMS can be successfully employed to directly probe virus-host interactions at the resolution of individual

Interoperability: linking design and tolerancing with metrology.

Science.gov (United States)

Morse, Edward; Heysiattalab, Saeed; Barnard-Feeney, Allison; Hedberg, Thomas

2016-01-01

On October 30, 2014 the American National Standards Institute (ANSI) approved QIF v 2.0 (Quality Information Framework, version 2.0) as an American National Standard. Subsequently in early 2016 QIF version 2.1 was approved. This paper describes how the QIF standard models the information necessary for quality workflow across the full metrology enterprise. After a brief description of the XML 'language' used in the standard, the paper reports on how the standard enables information exchange among four major activities in the metrology enterprise (product definition; measurement planning; measurement execution; and the analysis and reporting of the quality data).

Investigation of metrological parameters of measuring system for small temperature changes

Directory of Open Access Journals (Sweden)

Samynina M. G.

2014-02-01

Full Text Available Metrological parameters of the non-standard contact device were investigated to characterize its performance in temperature change measurements in the specified temperature range. Several series thermistors with a negative temperature coefficient of resistance connected into a linearization circuit were used as the sensing element of the semiconductor device. Increasing the number of thermistors leads to improved circuitry resolving power and reduced dispersion of this parameter. However, there is the question of optimal ratio of the number of thermistors and implemented temperature resolution, due to the nonlinear resolution dependence of the number of series-connected thermoelements. An example of scheme of four similar thermistors as the primary sensor and of a standard measuring instrument, which is working in ohmmeter mode, shows the ability to measure temperature changes at the level of hundredth of a Celsius degree. In this case, a quantization error, which is determined by a resolution of the measuring system, and the ohmmeter accuracy make the main contribution to the overall accuracy of measuring small temperature changes.

High pressure metrology for industrial applications

Science.gov (United States)

Sabuga, Wladimir; Rabault, Thierry; Wüthrich, Christian; Pražák, Dominik; Chytil, Miroslav; Brouwer, Ludwig; Ahmed, Ahmed D. S.

2017-12-01

To meet the needs of industries using high pressure technologies, in traceable, reliable and accurate pressure measurements, a joint research project of the five national metrology institutes and the university was carried out within the European Metrology Research Programme. In particular, finite element methods were established for stress-strain analysis of elastic and nonlinear elastic-plastic deformation, as well as of contact processes in pressure-measuring piston-cylinder assemblies, and high-pressure components at pressures above 1 GPa. New pressure measuring multipliers were developed and characterised, which allow realisation of the pressure scale up to 1.6 GPa. This characterisation is based on research including measurements of material elastic constants by the resonant ultrasound spectroscopy, hardness of materials of high pressure components, density and viscosity of pressure transmitting liquids at pressures up to 1.4 GPa and dimensional measurements on piston-cylinders. A 1.6 GPa pressure system was created for operation of the 1.6 GPa multipliers and calibration of high pressure transducers. A transfer standard for 1.5 GPa pressure range, based on pressure transducers, was built and tested. Herewith, the project developed the capability of measuring pressures up to 1.6 GPa, from which industrial users can calibrate their pressure measurement devices for accurate measurements up to 1.5 GPa.

Evaluation of the airway of the SimMan full-scale patient simulator

DEFF Research Database (Denmark)

Hesselfeldt, R; Kristensen, M S; Rasmussen, L S

2005-01-01

SimMan is a full-scale patient simulator, capable of simulating normal and pathological airways. The performance of SimMan has never been critically evaluated.......SimMan is a full-scale patient simulator, capable of simulating normal and pathological airways. The performance of SimMan has never been critically evaluated....

The role of the transcription factor SIM2 in prostate cancer.

Directory of Open Access Journals (Sweden)

Bin Lu

Full Text Available Recent reports have suggested a possible involvement of Single-minded homolog 2 (SIM2 in human solid cancers, including prostate cancer. However, the exact role of SIM2 in cancer in general, and in prostate cancer in particular, remains largely unknown. This study was designed to elucidate the role of SIM2 in prostate cancer using a shRNA-based approach in the PC3 prostate cancer cell line.Lentiviral shRNAs were used to inhibit SIM2 gene and protein levels in PC3 cells. Quantitative RT-PCR and branched DNA were performed to evaluate transcript expression. SIM2 protein expression level was measured by western blot. Profiling of gene expression spanning the whole genome, as well as polar metabolomics of several major metabolic pathways was performed to identify major pathway dysregulations.SIM2 gene and protein products were significantly downregulated by lenti-shRNA in PC3 cell line. This low expression of SIM2 affected gene expression profile, revealing significant changes in major signaling pathways, networks and functions. In addition, major metabolic pathways were affected.Taken together, our results suggest an involvement of SIM2 in key traits of prostate tumor cell biology and might underlie a contribution of this transcription factor to prostate cancer onset and progression.

Structural analysis of poly-SUMO chain recognition by the RNF4-SIMs domain.

Science.gov (United States)

Kung, Camy C-H; Naik, Mandar T; Wang, Szu-Huan; Shih, Hsiu-Ming; Chang, Che-Chang; Lin, Li-Ying; Chen, Chia-Lin; Ma, Che; Chang, Chi-Fon; Huang, Tai-Huang

2014-08-15

The E3 ubiquitin ligase RNF4 (RING finger protein 4) contains four tandem SIM [SUMO (small ubiquitin-like modifier)-interaction motif] repeats for selective interaction with poly-SUMO-modified proteins, which it targets for degradation. We employed a multi-faceted approach to characterize the structure of the RNF4-SIMs domain and the tetra-SUMO2 chain to elucidate the interaction between them. In solution, the SIM domain was intrinsically disordered and the linkers of the tetra-SUMO2 were highly flexible. Individual SIMs of the RNF4-SIMs domains bind to SUMO2 in the groove between the β2-strand and the α1-helix parallel to the β2-strand. SIM2 and SIM3 bound to SUMO with a high affinity and together constituted the recognition module necessary for SUMO binding. SIM4 alone bound to SUMO with low affinity; however, its contribution to tetra-SUMO2 binding avidity is comparable with that of SIM3 when in the RNF4-SIMs domain. The SAXS data of the tetra-SUMO2-RNF4-SIMs domain complex indicate that it exists as an ordered structure. The HADDOCK model showed that the tandem RNF4-SIMs domain bound antiparallel to the tetra-SUMO2 chain orientation and wrapped around the SUMO protamers in a superhelical turn without imposing steric hindrance on either molecule.

Ionic diffusion in quartz studied by transport measurements, SIMS and atomistic simulations

International Nuclear Information System (INIS)

Sartbaeva, Asel; Wells, Stephen A; Redfern, Simon A T; Hinton, Richard W; Reed, Stephen J B

2005-01-01

Ionic diffusion in the quartz-β-eucryptite system is studied by DC transport measurements, SIMS and atomistic simulations. Transport data show a large transient increase in ionic current at the α-β phase transition of quartz (the Hedvall effect). The SIMS data indicate two diffusion processes, one involving rapid Li + motion and the other involving penetration of Al and Li atoms into quartz at the phase transition. Atomistic simulations explain why the fine microstructure of twin domain walls in quartz near the transition does not hinder Li + diffusion

Accreditation experience of radioisotope metrology laboratory of Argentina

Energy Technology Data Exchange (ETDEWEB)

Iglicki, A. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)]. E-mail: iglicki@cae.cnea.gov.ar; Mila, M.I. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)]. E-mail: mila@cae.cnea.gov.ar; Furnari, J.C. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Arenillas, P. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Cerutti, G. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Carballido, M. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Guillen, V. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Araya, X. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Bianchini, R. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)

2006-10-15

This work presents the experience developed by the Radioisotope Metrology Laboratory (LMR), of the Argentine National Atomic Energy Commission (CNEA), as result of the accreditation process of the Quality System by ISO 17025 Standard. Considering the LMR as a calibration laboratory, services of secondary activity determinations and calibration of activimeters used in Nuclear Medicine were accredited. A peer review of the ({alpha}/{beta})-{gamma} coincidence system was also carried out. This work shows in detail the structure of the quality system, the results of the accrediting audit and gives the number of non-conformities detected and of observations made which have all been resolved.

Accreditation experience of radioisotope metrology laboratory of Argentina

International Nuclear Information System (INIS)

Iglicki, A.; Mila, M.I.; Furnari, J.C.; Arenillas, P.; Cerutti, G.; Carballido, M.; Guillen, V.; Araya, X.; Bianchini, R.

2006-01-01

This work presents the experience developed by the Radioisotope Metrology Laboratory (LMR), of the Argentine National Atomic Energy Commission (CNEA), as result of the accreditation process of the Quality System by ISO 17025 Standard. Considering the LMR as a calibration laboratory, services of secondary activity determinations and calibration of activimeters used in Nuclear Medicine were accredited. A peer review of the (α/β)-γ coincidence system was also carried out. This work shows in detail the structure of the quality system, the results of the accrediting audit and gives the number of non-conformities detected and of observations made which have all been resolved

Sim Track User's Manual (v 1.0)

Energy Technology Data Exchange (ETDEWEB)

Luo, Y.

2010-01-27

SimTrack is a simple c++ library designed for the numeric particle tracking in the high energy accelerators. It adopts the 4th order symplectic integrator for the optical transport in the magnetic elements. The 4-D and 6-D weak-strong beam-beam treatments are integrated in it for the beam-beam studies. SimTrack is written with c++ class and standard template library. It provides versatile functions to manage elements and lines. It supports a large range of types of elements. New type of element can be easily created in the library. SimTrack calculates Twiss, coupling and fits tunes, chromaticities and corrects closed orbits. AC dipole and AC multipole are available in this library. SimTrack allows change of element parameters during tracking.

Metrology for Grayscale Lithography

International Nuclear Information System (INIS)

Murali, Raghunath

2007-01-01

Three dimensional microstructures find applications in diffractive optical elements, photonic elements, etc. and can be efficiently fabricated by grayscale lithography. Good process control is important for achieving the desired structures. Metrology methods for grayscale lithography are discussed. Process optimization for grayscale e-beam lithography is explored and various process parameters that affect the grayscale process are discussed

MultiSimPC: a multilevel logic simulator for microcomputers

OpenAIRE

Kelly, John S.

1986-01-01

Approved for public release; distribution is unlimited This thesis describes extensions to a multilevel VLSI logic simulator named MultiSim. Originally developed by Dr. Ausif Mahmood of the Washington State University for large minicomputers such as the VAX-11/780; MultiSim is now operational on desktop microcomputers costing only a few thousand dollars. In addition, MultiSim has been expanded to include provisions for adding user-defined primitive cells to the circuit library, true mu...

Effect of measurement error budgets and hybrid metrology on qualification metrology sampling

Science.gov (United States)

Sendelbach, Matthew; Sarig, Niv; Wakamoto, Koichi; Kim, Hyang Kyun (Helen); Isbester, Paul; Asano, Masafumi; Matsuki, Kazuto; Osorio, Carmen; Archie, Chas

2014-10-01

Until now, metrologists had no statistics-based method to determine the sampling needed for an experiment before the start that accuracy experiment. We show a solution to this problem called inverse total measurement uncertainty (TMU) analysis, by presenting statistically based equations that allow the user to estimate the needed sampling after providing appropriate inputs, allowing him to make important "risk versus reward" sampling, cost, and equipment decisions. Application examples using experimental data from scatterometry and critical dimension scanning electron microscope tools are used first to demonstrate how the inverse TMU analysis methodology can be used to make intelligent sampling decisions and then to reveal why low sampling can lead to unstable and misleading results. One model is developed that can help experimenters minimize sampling costs. A second cost model reveals the inadequacy of some current sampling practices-and the enormous costs associated with sampling that provides reasonable levels of certainty in the result. We introduce the strategies on how to manage and mitigate these costs and begin the discussion on how fabs are able to manufacture devices using minimal reference sampling when qualifying metrology steps. Finally, the relationship between inverse TMU analysis and hybrid metrology is explored.

5th Conference on Advanced Mathematical and Computational Tools in Metrology

CERN Document Server

Cox, M G; Filipe, E; Pavese, F; Richter, D

2001-01-01

Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people

SIMS imaging of gadolinium isotopes in tissue from Nephrogenic Systemic Fibrosis patients: Release of free Gd from magnetic resonance imaging (MRI) contrast agents

Energy Technology Data Exchange (ETDEWEB)

Abraham, Jerrold L. [Department of Pathology, SUNY Upstate Medical University, Syracuse, New York (United States); Chandra, Subhash [Cornell SIMS Laboratory, Department of Earth and Atmospheric Sciences, Cornell University, Ithaca, NY 14853 (United States)], E-mail: sc40@cornell.edu; Thakral, Charu [Department of Pathology, SUNY Upstate Medical University, Syracuse, New York (United States); Abraham, Joshua M. [Cornell SIMS Laboratory, Department of Earth and Atmospheric Sciences, Cornell University, Ithaca, NY 14853 (United States)

2008-12-15

Recently, Gd-based magnetic resonance imaging (MRI) contrast agents (GBMCA) have been linked to a new disease, Nephrogenic Systemic Fibrosis (NSF), with skin and systemic toxicity and death in certain patients with renal failure. Due to widespread use of GBMCA in diagnostic MRI, it is essential to study their excretion, metabolism, and target sites in cells and tissues. A CAMECA IMS-3f SIMS ion microscope and scanning electron microscopy (SEM) with energy dispersive X-ray spectroscopy (EDS) were used for imaging Gd isotopes in relation to calcium distributions in histologic sections of human tissues. SIMS imaging revealed two types of Gd localization in skin biopsies of patients who received GBMCA. The Gd was present in micrometer size deposits in association with calcium, and in detectable amounts in a more diffuse cellular distribution. Only the Gd-containing deposits associated with Ca and P were detectable using SEM/EDS. As only insoluble deposits remain in the biopsy tissues after aqueous and organic solvent processing of the tissue, our observations support release of free Gd from the GBMCA and selective localization of insoluble Gd in the target tissue from patients with NSF. This study opens new novel applications of SIMS for characterization of the safety of GBMCA.

CoaSim Guile Manual — Using the Guile-based CoaSim Simulator

DEFF Research Database (Denmark)

Mailund, T

2006-01-01

CoaSim is a tool for simulating the coalescent process with recombination and geneconversion, under either constant population size or exponential population growth. It effectively constructs the ancestral recombination graph for a given number of chromosomes and uses this to simulate samples...

SIMS device with quadrupole mass spectrometer

International Nuclear Information System (INIS)

Szigethy, D.; Riedel, M.

1980-01-01

A versatile secondary ion mass spectrometer (SIMS) has been designed and constructed. The device is applicable for dinamic and static SIMS investigations. The sputtering and ionisation can be studied simultaneously. Oil diffusion pumps and an auxiliary ion-getter pump are used. A commercial ion gun is used in the working chamber. The secondary ion optics assures the preliminary filtering of fast ions, and the collection of sputtered ions for a separate microprobe analysis. The performance of the apparatus is illustrated with examples. (R.J.)

Improving the Molecular Ion Signal Intensity for In Situ Liquid SIMS Analysis.

Science.gov (United States)

Zhou, Yufan; Yao, Juan; Ding, Yuanzhao; Yu, Jiachao; Hua, Xin; Evans, James E; Yu, Xiaofei; Lao, David B; Heldebrant, David J; Nune, Satish K; Cao, Bin; Bowden, Mark E; Yu, Xiao-Ying; Wang, Xue-Lin; Zhu, Zihua

2016-12-01

In situ liquid secondary ion mass spectrometry (SIMS) enabled by system for analysis at the liquid vacuum interface (SALVI) has proven to be a promising new tool to provide molecular information at solid-liquid and liquid-vacuum interfaces. However, the initial data showed that useful signals in positive ion spectra are too weak to be meaningful in most cases. In addition, it is difficult to obtain strong negative molecular ion signals when m/z>200. These two drawbacks have been the biggest obstacle towards practical use of this new analytical approach. In this study, we report that strong and reliable positive and negative molecular signals are achievable after optimizing the SIMS experimental conditions. Four model systems, including a 1,8-diazabicycloundec-7-ene (DBU)-base switchable ionic liquid, a live Shewanella oneidensis biofilm, a hydrated mammalian epithelia cell, and an electrolyte popularly used in Li ion batteries were studied. A signal enhancement of about two orders of magnitude was obtained in comparison with non-optimized conditions. Therefore, molecular ion signal intensity has become very acceptable for use of in situ liquid SIMS to study solid-liquid and liquid-vacuum interfaces. Graphical Abstract ᅟ.

SimPhospho: a software tool enabling confident phosphosite assignment.

Science.gov (United States)

Suni, Veronika; Suomi, Tomi; Tsubosaka, Tomoya; Imanishi, Susumu Y; Elo, Laura L; Corthals, Garry L

2018-03-27

Mass spectrometry combined with enrichment strategies for phosphorylated peptides has been successfully employed for two decades to identify sites of phosphorylation. However, unambiguous phosphosite assignment is considered challenging. Given that site-specific phosphorylation events function as different molecular switches, validation of phosphorylation sites is of utmost importance. In our earlier study we developed a method based on simulated phosphopeptide spectral libraries, which enables highly sensitive and accurate phosphosite assignments. To promote more widespread use of this method, we here introduce a software implementation with improved usability and performance. We present SimPhospho, a fast and user-friendly tool for accurate simulation of phosphopeptide tandem mass spectra. Simulated phosphopeptide spectral libraries are used to validate and supplement database search results, with a goal to improve reliable phosphoproteome identification and reporting. The presented program can be easily used together with the Trans-Proteomic Pipeline and integrated in a phosphoproteomics data analysis workflow. SimPhospho is available for Windows, Linux and Mac operating systems at https://sourceforge.net/projects/simphospho/. It is open source and implemented in C ++. A user's manual with detailed description of data analysis using SimPhospho as well as test data can be found as supplementary material of this article. Supplementary data are available at https://www.btk.fi/research/ computational-biomedicine/software/.

Metrology network: a case study on the metrology network of defense and security from SIBRATEC

International Nuclear Information System (INIS)

Pereira, Marisa Ferraz Figueira

2016-01-01

This study is focused on understanding the effects of the infrastructure improvement of these laboratories and the role of network management in offering support and metrological services to the defense and security sector enterprises, within the project purposes. It is also aimed identify gaps on offering calibration and, or testing services to supply demands of the defense and security industries, and analyze adequacy of RDS project to demands of defense and security industries, with the purpose to contribute with information for future actions. The experimental research is qualitative type, with exploratory research characteristics, based on case study. It was structured in two parts, involving primary data collection and secondary data. In order to collect the primary data two questionnaires were prepared, one (Questionnaire A) to the five RDS laboratories representatives and other (Questionnaire B) to the contacts of 63 defense and security enterprises which need calibration and test services, possible customers of RDS laboratories. Answers from four representatives of RDS laboratories and from 26 defense and security enterprises were obtained. The collection of secondary data was obtained from documentary research. The analysis was made based on five dimensions defined in order to organize and improve the understanding of the research setting. They are RDS project coverage, regional, network management, metrological traceability and importance and visibility of RDS. The results indicated that the performance of RDS does not interfere, by that time, in the metrological traceability of the products of the defense and security enterprises that participated in the research. (author)

JASSA: a comprehensive tool for prediction of SUMOylation sites and SIMs.

Science.gov (United States)

Beauclair, Guillaume; Bridier-Nahmias, Antoine; Zagury, Jean-François; Saïb, Ali; Zamborlini, Alessia

2015-11-01

Post-translational modification by the Small Ubiquitin-like Modifier (SUMO) proteins, a process termed SUMOylation, is involved in many fundamental cellular processes. SUMO proteins are conjugated to a protein substrate, creating an interface for the recruitment of cofactors harboring SUMO-interacting motifs (SIMs). Mapping both SUMO-conjugation sites and SIMs is required to study the functional consequence of SUMOylation. To define the best candidate sites for experimental validation we designed JASSA, a Joint Analyzer of SUMOylation site and SIMs. JASSA is a predictor that uses a scoring system based on a Position Frequency Matrix derived from the alignment of experimental SUMOylation sites or SIMs. Compared with existing web-tools, JASSA displays on par or better performances. Novel features were implemented towards a better evaluation of the prediction, including identification of database hits matching the query sequence and representation of candidate sites within the secondary structural elements and/or the 3D fold of the protein of interest, retrievable from deposited PDB files. JASSA is freely accessible at http://www.jassa.fr/. Website is implemented in PHP and MySQL, with all major browsers supported. guillaume.beauclair@inserm.fr Supplementary data are available at Bioinformatics online. © The Author 2015. Published by Oxford University Press. All rights reserved. For Permissions, please e-mail: journals.permissions@oup.com.

SimZones: An Organizational Innovation for Simulation Programs and Centers.

Science.gov (United States)

Roussin, Christopher J; Weinstock, Peter

2017-08-01

The complexity and volume of simulation-based learning programs have increased dramatically over the last decade, presenting several major challenges for those who lead and manage simulation programs and centers. The authors present five major issues affecting the organization of simulation programs: (1) supporting both single- and double-loop learning experiences; (2) managing the training of simulation teaching faculty; (3) optimizing the participant mix, including individuals, professional groups, teams, and other role-players, to ensure learning; (4) balancing in situ, node-based, and center-based simulation delivery; and (5) organizing simulation research and measuring value. They then introduce the SimZones innovation, a system of organization for simulation-based learning, and explain how it can alleviate the problems associated with these five issues.Simulations are divided into four zones (Zones 0-3). Zone 0 simulations include autofeedback exercises typically practiced by solitary learners, often using virtual simulation technology. Zone 1 simulations include hands-on instruction of foundational clinical skills. Zone 2 simulations include acute situational instruction, such as clinical mock codes. Zone 3 simulations involve authentic, native teams of participants and facilitate team and system development.The authors also discuss the translation of debriefing methods from Zone 3 simulations to real patient care settings (Zone 4), and they illustrate how the SimZones approach can enable the development of longitudinal learning systems in both teaching and nonteaching hospitals. The SimZones approach was initially developed in the context of the Boston Children's Hospital Simulator Program, which the authors use to illustrate this innovation in action.

Improving automated 3D reconstruction methods via vision metrology

Science.gov (United States)

Toschi, Isabella; Nocerino, Erica; Hess, Mona; Menna, Fabio; Sargeant, Ben; MacDonald, Lindsay; Remondino, Fabio; Robson, Stuart

2015-05-01

This paper aims to provide a procedure for improving automated 3D reconstruction methods via vision metrology. The 3D reconstruction problem is generally addressed using two different approaches. On the one hand, vision metrology (VM) systems try to accurately derive 3D coordinates of few sparse object points for industrial measurement and inspection applications; on the other, recent dense image matching (DIM) algorithms are designed to produce dense point clouds for surface representations and analyses. This paper strives to demonstrate a step towards narrowing the gap between traditional VM and DIM approaches. Efforts are therefore intended to (i) test the metric performance of the automated photogrammetric 3D reconstruction procedure, (ii) enhance the accuracy of the final results and (iii) obtain statistical indicators of the quality achieved in the orientation step. VM tools are exploited to integrate their main functionalities (centroid measurement, photogrammetric network adjustment, precision assessment, etc.) into the pipeline of 3D dense reconstruction. Finally, geometric analyses and accuracy evaluations are performed on the raw output of the matching (i.e. the point clouds) by adopting a metrological approach. The latter is based on the use of known geometric shapes and quality parameters derived from VDI/VDE guidelines. Tests are carried out by imaging the calibrated Portable Metric Test Object, designed and built at University College London (UCL), UK. It allows assessment of the performance of the image orientation and matching procedures within a typical industrial scenario, characterised by poor texture and known 3D/2D shapes.

Quality control of secondary standards and calibration systems, therapy level, of National Laboratory of Metrology from Ionizing Radiations (LNMRI)

International Nuclear Information System (INIS)

Cecatti, E.R.; Freitas, L.C. de

1992-01-01

The results of quality control program of secondary standards, therapy level, and the calibration system of clinical dosemeters were analysed from 1984, when a change in the laboratory installation occurred and new standards were obtained. The national and the international intercomparisons were emphasised. The results for graphite wall chambers were compared, observing a maximum variation of about 0,6%. In the case of Delrin (TK01) wall chambers, the maximum variation was 1,7%. The results of post intercomparisons with thermoluminescent dosemeters have presented derivations lesser than 1%, securing the standards consistence at LNMRI with the international metrological system. (C.G.C.)

Simulation of multi-photon emission isotopes using time-resolved SimSET multiple photon history generator

Energy Technology Data Exchange (ETDEWEB)

Chiang, Chih-Chieh; Lin, Hsin-Hon; Lin, Chang-Shiun; Chuang, Keh-Shih [Department of Biomedical Engineering and Environmental Sciences, National Tsing-HuaUniversity, Hsinchu, Taiwan (China); Jan, Meei-Ling [Health Physics Division, Institute of Nuclear Energy Research, Atomic Energy Council, Taoyuan, Taiwan (China)

2015-07-01

Abstract-Multiple-photon emitters, such as In-111 or Se-75, have enormous potential in the field of nuclear medicine imaging. For example, Se-75 can be used to investigate the bile acid malabsorption and measure the bile acid pool loss. The simulation system for emission tomography (SimSET) is a well-known Monte Carlo simulation (MCS) code in nuclear medicine for its high computational efficiency. However, current SimSET cannot simulate these isotopes due to the lack of modeling of complex decay scheme and the time-dependent decay process. To extend the versatility of SimSET for simulation of those multi-photon emission isotopes, a time-resolved multiple photon history generator based on SimSET codes is developed in present study. For developing the time-resolved SimSET (trSimSET) with radionuclide decay process, the new MCS model introduce new features, including decay time information and photon time-of-flight information, into this new code. The half-life of energy states were tabulated from the Evaluated Nuclear Structure Data File (ENSDF) database. The MCS results indicate that the overall percent difference is less than 8.5% for all simulation trials as compared to GATE. To sum up, we demonstrated that time-resolved SimSET multiple photon history generator can have comparable accuracy with GATE and keeping better computational efficiency. The new MCS code is very useful to study the multi-photon imaging of novel isotopes that needs the simulation of lifetime and the time-of-fight measurements. (authors)

Detection and distribution of lithium in Mg-Li-Al based alloy by ToF-SIMS

Energy Technology Data Exchange (ETDEWEB)

Kumar, Vinod, E-mail: vkt.meta@mnit.ac.in [Metallurgical and Materials Engineering, MNIT Jaipur, 302017 (India); Adjunct Faculty, Materials Research Centre, MNIT Jaipur, 302017 (India)

2016-12-01

Highlights: • First time, Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) is used to investigate the surface as well as bulk microstructural features of novel Mg-Li-Al based alloy. • There are six multi-oxide layers present within the surface film of LATZ9531R. • Secondary ion imaging by ToF-SIMS with mass contrast effect (including Li) is possible for a multiphase lithium-containing alloy systems. - Abstract: Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) is used to investigate the surface as well as bulk microstructural features of novel Mg-Li-Al based alloy namely Mg-9Li-7Al-3Sn-1Zn (LATZ9531). ToF-SIMS study indicates that there are six multi-oxide layers present within the surface film of LATZ9531. Furthermore, The presence of Li containing phase has been qualitatively confirmed based on the high number of Li-ion counts in SIMS, and the same is verified quantitatively by using electron probe microanalysis (EPMA). The novel approach may be useful to determine the chemical composition of the phases in various alloys which has lighter alloying elements such as lithium.

Metrology for Fuel Cell Manufacturing

Energy Technology Data Exchange (ETDEWEB)

Stocker, Michael [National Inst. of Standards and Technology, Gaithersburg, MD (United States); Stanfield, Eric [National Inst. of Standards and Technology, Gaithersburg, MD (United States)

2015-02-04

The project was divided into three subprojects. The first subproject is Fuel Cell Manufacturing Variability and Its Impact on Performance. The objective was to determine if flow field channel dimensional variability has an impact on fuel cell performance. The second subproject is Non-contact Sensor Evaluation for Bipolar Plate Manufacturing Process Control and Smart Assembly of Fuel Cell Stacks. The objective was to enable cost reduction in the manufacture of fuel cell plates by providing a rapid non-contact measurement system for in-line process control. The third subproject is Optical Scatterfield Metrology for Online Catalyst Coating Inspection of PEM Soft Goods. The objective was to evaluate the suitability of Optical Scatterfield Microscopy as a viable measurement tool for in situ process control of catalyst coatings.

Bell Inequality, Einstein-Podolsky-Rosen Steering, and Quantum Metrology with Spinor Bose-Einstein Condensates

Science.gov (United States)

Wasak, Tomasz; Chwedeńczuk, Jan

2018-04-01

We propose an experiment, where the Bell inequality is violated in a many-body system of massive particles. The source of correlated atoms is a spinor F =1 Bose-Einstein condensate residing in an optical lattice. We characterize the complete procedure—the local operations, the measurements, and the inequality—necessary to run the Bell test. We show how the degree of violation of the Bell inequality depends on the strengths of the two-body correlations and on the number of scattered pairs. We show that the system can be used to demonstrate the Einstein-Podolsky-Rosen paradox. Also, the scattered pairs are an excellent many-body resource for the quantum-enhanced metrology. Our results apply to any multimode system where the spin-changing collision drives the scattering into separate regions. The presented inquiry shows that such a system is versatile as it can be used for the tests of nonlocality, quantum metrology, and quantum information.

Bell Inequality, Einstein-Podolsky-Rosen Steering, and Quantum Metrology with Spinor Bose-Einstein Condensates.

Science.gov (United States)

Wasak, Tomasz; Chwedeńczuk, Jan

2018-04-06

We propose an experiment, where the Bell inequality is violated in a many-body system of massive particles. The source of correlated atoms is a spinor F=1 Bose-Einstein condensate residing in an optical lattice. We characterize the complete procedure-the local operations, the measurements, and the inequality-necessary to run the Bell test. We show how the degree of violation of the Bell inequality depends on the strengths of the two-body correlations and on the number of scattered pairs. We show that the system can be used to demonstrate the Einstein-Podolsky-Rosen paradox. Also, the scattered pairs are an excellent many-body resource for the quantum-enhanced metrology. Our results apply to any multimode system where the spin-changing collision drives the scattering into separate regions. The presented inquiry shows that such a system is versatile as it can be used for the tests of nonlocality, quantum metrology, and quantum information.

Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory

International Nuclear Information System (INIS)

Advanced Light Source; Yashchuk, Valeriy V; Kirschman, Jonathan L.; Domning, Edward E.; McKinney, Wayne R.; Morrison, Gregory Y.; Smith, Brian V.; Yashchuk, Valeriy V.

2008-01-01

The next generation of synchrotrons and free electron laser facilities requires x-ray optical systems with extremely high performance, generally of diffraction limited quality. Fabrication and use of such optics requires adequate, highly accurate metrology and dedicated instrumentation. Previously, we suggested ways to improve the performance of the Long Trace Profiler (LTP), a slope measuring instrument widely used to characterize x-ray optics at long spatial wavelengths. The main way is use of a CCD detector and corresponding technique for calibration of photo-response non-uniformity [J. L. Kirschman, et al., Proceedings of SPIE 6704, 67040J (2007)]. The present work focuses on the performance and characteristics of the upgraded LTP-II at the ALS Optical Metrology Laboratory. This includes a review of the overall aspects of the design, control system, the movement and measurement regimes for the stage, and analysis of the performance by a slope measurement of a highly curved super-quality substrate with less than 0.3 microradian (rms)slope variation

General methodology for exergy balance in ProSimPlus® process simulator

International Nuclear Information System (INIS)

Ghannadzadeh, Ali; Thery-Hetreux, Raphaële; Baudouin, Olivier; Baudet, Philippe; Floquet, Pascal; Joulia, Xavier

2012-01-01

This paper presents a general methodology for exergy balance in chemical and thermal processes integrated in ProSimPlus ® as a well-adapted process simulator for energy efficiency analysis. In this work, as well as using the general expressions for heat and work streams, the whole exergy balance is presented within only one software in order to fully automate exergy analysis. In addition, after exergy balance, the essential elements such as source of irreversibility for exergy analysis are presented to help the user for modifications on either process or utility system. The applicability of the proposed methodology in ProSimPlus ® is shown through a simple scheme of Natural Gas Liquids (NGL) recovery process and its steam utility system. The methodology does not only provide the user with necessary exergetic criteria to pinpoint the source of exergy losses, it also helps the user to find the way to reduce the exergy losses. These features of the proposed exergy calculator make it preferable for its implementation in ProSimPlus ® to define the most realistic and profitable retrofit projects on the existing chemical and thermal plants. -- Highlights: ► A set of new expressions for calculation of exergy of material streams is developed. ► A general methodology for exergy balance in ProSimPlus ® is presented. ► A panel of solutions based on exergy analysis is provided to help the user for modifications on process flowsheets. ► The exergy efficiency is chosen as a variable in a bi-criteria optimization.

Metrology in CNEN NN 3.05/13 standard

International Nuclear Information System (INIS)

Mello, Marina Santiago de

2014-01-01

The nuclear medicine exams are widely used tools in health services for a reliable clinical and functional diagnosis of a disease. In Brazil, the National Nuclear Energy Commission, through the norm CNEN-NN 3:05/13, provides for the requirements of safety and radiological protection in nuclear medicine services. The objective of this review article was to emphasize the importance of metrology in compliance with this norm. We observed that metrology plays a vital role as it ensures the quality, accuracy, reproducibility and consistency of the measurements in the field of nuclear medicine. (author)

Activities of the IPEN laboratory (CNEN/SP - Brazil) of nuclear metrology

International Nuclear Information System (INIS)

Dias, M.S.; Koskinas, M.F.; Pocobi, E.; Silva, C.A.M.; Machado, R.R.

1987-01-01

The determination of radionuclide activity for radioactive sources and standardized solutions is reported as the main purpose of the IPEN laboratory of nuclear metrology. The measurement systems installed in the laboratory, the measurable activity intervals and some of the standardized radionuclides (emphasizing the ones used in nuclear medicine) are presented. (M.A.C.) [pt

PowderSim: Lagrangian Discrete and Mesh-Free Continuum Simulation Code for Cohesive Soils

Science.gov (United States)

Johnson, Scott; Walton, Otis; Settgast, Randolph

2013-01-01

PowderSim is a calculation tool that combines a discrete-element method (DEM) module, including calibrated interparticle-interaction relationships, with a mesh-free, continuum, SPH (smoothed-particle hydrodynamics) based module that utilizes enhanced, calibrated, constitutive models capable of mimicking both large deformations and the flow behavior of regolith simulants and lunar regolith under conditions anticipated during in situ resource utilization (ISRU) operations. The major innovation introduced in PowderSim is to use a mesh-free method (SPH-based) with a calibrated and slightly modified critical-state soil mechanics constitutive model to extend the ability of the simulation tool to also address full-scale engineering systems in the continuum sense. The PowderSim software maintains the ability to address particle-scale problems, like size segregation, in selected regions with a traditional DEM module, which has improved contact physics and electrostatic interaction models.

The portrayal of J. Marion Sims' controversial surgical legacy.

Science.gov (United States)

Spettel, Sara; White, Mark Donald

2011-06-01

In the mid 1800s Dr. J. Marion Sims reported the successful repair of vesicovaginal fistulas with a technique he developed by performing multiple operations on female slaves. A venerated physician in his time, the legacy of Dr. Sims is controversial and represents a significant chapter in the mistreatment of African-Americans by the medical establishment. This review compares the modern debate surrounding his legacy with the presentation of his operation in widely consulted urological texts and journals. A literature review was performed of medical, sociological and periodical sources (1851 to the present) regarding J. Marion Sims and vesicovaginal fistula repair. During the last several decades, while the controversy around Dr. Sims' surgical development has produced a steady stream of articles in the historical and popular literature, relatively little mention is found in standard urology textbooks or journals. With increased public attention, some have debated the removal or modification of public tributes to Dr. Sims. This move has been countered by arguments against the validity of judging a 19th century physician by modern standards. While historians, ethicists and the popular press have debated Dr. Sims' legacy, medical sources have continued to portray him unquestionably as a great figure in medical history. This division keeps the medical profession uninformed and detached from the public debate on his legacy and, thus, the larger issues of ethical treatment of surgical patients. Copyright © 2011 American Urological Association Education and Research, Inc. Published by Elsevier Inc. All rights reserved.

Adjustment method for embedded metrology engine in an EM773 series microcontroller.

Science.gov (United States)

Blazinšek, Iztok; Kotnik, Bojan; Chowdhury, Amor; Kačič, Zdravko

2015-09-01

This paper presents the problems of implementation and adjustment (calibration) of a metrology engine embedded in NXP's EM773 series microcontroller. The metrology engine is used in a smart metering application to collect data about energy utilization and is controlled with the use of metrology engine adjustment (calibration) parameters. The aim of this research is to develop a method which would enable the operators to find and verify the optimum parameters which would ensure the best possible accuracy. Properly adjusted (calibrated) metrology engines can then be used as a base for variety of products used in smart and intelligent environments. This paper focuses on the problems encountered in the development, partial automatisation, implementation and verification of this method. Copyright © 2015 ISA. Published by Elsevier Ltd. All rights reserved.

Metrology of human-based and other qualitative measurements

Science.gov (United States)

Pendrill, Leslie; Petersson, Niclas

2016-09-01

The metrology of human-based and other qualitative measurements is in its infancy—concepts such as traceability and uncertainty are as yet poorly developed. This paper reviews how a measurement system analysis approach, particularly invoking as performance metric the ability of a probe (such as a human being) acting as a measurement instrument to make a successful decision, can enable a more general metrological treatment of qualitative observations. Measures based on human observations are typically qualitative, not only in sectors, such as health care, services and safety, where the human factor is obvious, but also in customer perception of traditional products of all kinds. A principal challenge is that the usual tools of statistics normally employed for expressing measurement accuracy and uncertainty will probably not work reliably if relations between distances on different portions of scales are not fully known, as is typical of ordinal or other qualitative measurements. A key enabling insight is to connect the treatment of decision risks associated with measurement uncertainty to generalized linear modelling (GLM). Handling qualitative observations in this way unites information theory, the perceptive identification and choice paradigms of psychophysics. The Rasch invariant measure psychometric GLM approach in particular enables a proper treatment of ordinal data; a clear separation of probe and item attribute estimates; simple expressions for instrument sensitivity; etc. Examples include two aspects of the care of breast cancer patients, from diagnosis to rehabilitation. The Rasch approach leads in turn to opportunities of establishing metrological references for quality assurance of qualitative measurements. In psychometrics, one could imagine a certified reference for knowledge challenge, for example, a particular concept in understanding physics or for product quality of a certain health care service. Multivariate methods, such as Principal Component

Metrology of human-based and other qualitative measurements

International Nuclear Information System (INIS)

Pendrill, Leslie; Petersson, Niclas

2016-01-01

The metrology of human-based and other qualitative measurements is in its infancy—concepts such as traceability and uncertainty are as yet poorly developed. This paper reviews how a measurement system analysis approach, particularly invoking as performance metric the ability of a probe (such as a human being) acting as a measurement instrument to make a successful decision, can enable a more general metrological treatment of qualitative observations. Measures based on human observations are typically qualitative, not only in sectors, such as health care, services and safety, where the human factor is obvious, but also in customer perception of traditional products of all kinds. A principal challenge is that the usual tools of statistics normally employed for expressing measurement accuracy and uncertainty will probably not work reliably if relations between distances on different portions of scales are not fully known, as is typical of ordinal or other qualitative measurements. A key enabling insight is to connect the treatment of decision risks associated with measurement uncertainty to generalized linear modelling (GLM). Handling qualitative observations in this way unites information theory, the perceptive identification and choice paradigms of psychophysics. The Rasch invariant measure psychometric GLM approach in particular enables a proper treatment of ordinal data; a clear separation of probe and item attribute estimates; simple expressions for instrument sensitivity; etc. Examples include two aspects of the care of breast cancer patients, from diagnosis to rehabilitation. The Rasch approach leads in turn to opportunities of establishing metrological references for quality assurance of qualitative measurements. In psychometrics, one could imagine a certified reference for knowledge challenge, for example, a particular concept in understanding physics or for product quality of a certain health care service. Multivariate methods, such as Principal Component

HexSim: a modeling environment for ecology and conservation.

Science.gov (United States)

HexSim is a powerful and flexible new spatially-explicit, individual based modeling environment intended for use in ecology, conservation, genetics, epidemiology, toxicology, and other disciplines. We describe HexSim, illustrate past applications that contributed to our >10 year ...

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

Czech Academy of Sciences Publication Activity Database

Řeřucha, Šimon; Yacoot, A.; Pham, Minh Tuan; Čížek, Martin; Hucl, Václav; Lazar, Josef; Číp, Ondřej

2017-01-01

Roč. 28, č. 4 (2017), s. 1-11, č. článku 045204. ISSN 0957-0233 R&D Projects: GA ČR GB14-36681G; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01; GA TA ČR TE01020233 Institutional support: RVO:68081731 Keywords : optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement Subject RIV: BH - Optics, Masers, Lasers OBOR OECD: Optics (including laser optics and quantum optics) Impact factor: 1.585, year: 2016

Metrology and Proportion in the Ecclesiastical Architecture of Medieval Ireland

OpenAIRE

Behan, Avril; Moss, Rachel

2008-01-01

The aim of this paper is to examine the extent to which detailed empirical analysis of the metrology and proportional systems used in the design of Irish ecclesiastical architecture can be analysed to provide historical information not otherwise available. Focussing on a relatively limited sample of window tracery designs as a case study, it will first set out to establish what, if any, systems were in use, and then what light these might shed on the background, training and work practices of...

Alternative Liquid Fuels Simulation Model (AltSim).

Energy Technology Data Exchange (ETDEWEB)

Williams, Ryan; Baker, Arnold Barry; Drennen, Thomas E.

2009-12-01

The Alternative Liquid Fuels Simulation Model (AltSim) is a high-level dynamic simulation model which calculates and compares the production and end use costs, greenhouse gas emissions, and energy balances of several alternative liquid transportation fuels. These fuels include: corn ethanol, cellulosic ethanol from various feedstocks (switchgrass, corn stover, forest residue, and farmed trees), biodiesel, and diesels derived from natural gas (gas to liquid, or GTL), coal (coal to liquid, or CTL), and coal with biomass (CBTL). AltSim allows for comprehensive sensitivity analyses on capital costs, operation and maintenance costs, renewable and fossil fuel feedstock costs, feedstock conversion ratio, financial assumptions, tax credits, CO{sub 2} taxes, and plant capacity factor. This paper summarizes the structure and methodology of AltSim, presents results, and provides a detailed sensitivity analysis. The Energy Independence and Security Act (EISA) of 2007 sets a goal for the increased use of biofuels in the U.S., ultimately reaching 36 billion gallons by 2022. AltSim's base case assumes EPA projected feedstock costs in 2022 (EPA, 2009). For the base case assumptions, AltSim estimates per gallon production costs for the five ethanol feedstocks (corn, switchgrass, corn stover, forest residue, and farmed trees) of $1.86, $2.32, $2.45, $1.52, and $1.91, respectively. The projected production cost of biodiesel is $1.81/gallon. The estimates for CTL without biomass range from $1.36 to $2.22. With biomass, the estimated costs increase, ranging from $2.19 per gallon for the CTL option with 8% biomass to $2.79 per gallon for the CTL option with 30% biomass and carbon capture and sequestration. AltSim compares the greenhouse gas emissions (GHG) associated with both the production and consumption of the various fuels. EISA allows fuels emitting 20% less greenhouse gases (GHG) than conventional gasoline and diesels to qualify as renewable fuels. This allows several of the

WEC-SIM Phase 1 Validation Testing -- Numerical Modeling of Experiments: Preprint

Energy Technology Data Exchange (ETDEWEB)

Ruehl, Kelley; Michelen, Carlos; Bosma, Bret; Yu, Yi-Hsiang

2016-08-01

The Wave Energy Converter Simulator (WEC-Sim) is an open-source code jointly developed by Sandia National Laboratories and the National Renewable Energy Laboratory. It is used to model wave energy converters subjected to operational and extreme waves. In order for the WEC-Sim code to be beneficial to the wave energy community, code verification and physical model validation is necessary. This paper describes numerical modeling of the wave tank testing for the 1:33-scale experimental testing of the floating oscillating surge wave energy converter. The comparison between WEC-Sim and the Phase 1 experimental data set serves as code validation. This paper is a follow-up to the WEC-Sim paper on experimental testing, and describes the WEC-Sim numerical simulations for the floating oscillating surge wave energy converter.

The Remarkable Metrological History of Radiocarbon Dating [II].

Science.gov (United States)

Currie, Lloyd A

2004-01-01

This article traces the metrological history of radiocarbon, from the initial breakthrough devised by Libby, to minor (evolutionary) and major (revolutionary) advances that have brought (14)C measurement from a crude, bulk [8 g carbon] dating tool, to a refined probe for dating tiny amounts of precious artifacts, and for "molecular dating" at the 10 µg to 100 µg level. The metrological advances led to opportunities and surprises, such as the non-monotonic dendrochronological calibration curve and the "bomb effect," that gave rise to new multidisciplinary areas of application, ranging from archaeology and anthropology to cosmic ray physics to oceanography to apportionment of anthropogenic pollutants to the reconstruction of environmental history. Beyond the specific topic of natural (14)C, it is hoped that this account may serve as a metaphor for young scientists, illustrating that just when a scientific discipline may appear to be approaching maturity, unanticipated metrological advances in their own chosen fields, and unanticipated anthropogenic or natural chemical events in the environment, can spawn new areas of research having exciting theoretical and practical implications.

SIMS Studies of Allende Projectiles Fired into Stardust-type Aluminum Foils at 6 km/s

Science.gov (United States)

Hoppe, Peter; Stadermann, Frank J.; Stephan, Thomas; Floss, Christine; Leitner, Jan; Marhas, Kuljeet; Horz, Friedrich

2006-01-01

We have explored the feasibility of C-, N-, and O-isotopic measurements by NanoSIMS and of elemental abundance determinations by TOF-SIMS on residues of Allende projectiles that impacted Stardust-type aluminum foils in the laboratory at 6 km/s. These investigations are part of a consortium study aimed at providing the foundation for the characterization of matter associated with micro-craters that were produced during the encounter of the Stardust space probe with comet 81P/Wild 2. Eleven experimental impact craters were studied by NanoSIMS and eighteen by TOF-SIMS. Crater sizes were between 3 and 190 microns. The NanoSIMS measurements have shown that the crater morphology has only a minor effect on spatial resolution and on instrumental mass fractionation. The achievable spatial resolution is always better than 200 nm, and C- and O-isotopic ratios can be measured with a precision of several percent at a scale of several 100 nm, the typical size of presolar grains. This clearly demonstrates that presolar matter, provided it survives the impact into the aluminum foil partly intact, is recognizable even if embedded in material of Solar System origin. TOF-SIMS studies are restricted to materials from the crater rim. The element ratios of the major rockforming elements in the Allende projectiles are well characterized by the TOF-SIMS measurements, indicating that fractionation of those elements during impact can be expected to be negligible. This permits information on the type of impactor material to be obtained. For any more detailed assignments to specific chondrite groups, however, information on the abundances of the light elements, especially C, is crucial.

DABAM: an open-source database of X-ray mirrors metrology

Energy Technology Data Exchange (ETDEWEB)

Sanchez del Rio, Manuel, E-mail: srio@esrf.eu [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Bianchi, Davide [AC2T Research GmbH, Viktro-Kaplan-Strasse 2-C, 2700 Wiener Neustadt (Austria); Cocco, Daniele [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025 (United States); Glass, Mark [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Idir, Mourad [NSLS II, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Metz, Jim [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Raimondi, Lorenzo; Rebuffi, Luca [Elettra-Sincrotrone Trieste SCpA, Basovizza (TS) (Italy); Reininger, Ruben; Shi, Xianbo [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States); Siewert, Frank [BESSY II, Helmholtz Zentrum Berlin, Institute for Nanometre Optics and Technology, Albert-Einstein-Strasse 15, 12489 Berlin (Germany); Spielmann-Jaeggi, Sibylle [Swiss Light Source at Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Takacs, Peter [Instrumentation Division, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Tomasset, Muriel [Synchrotron Soleil (France); Tonnessen, Tom [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Vivo, Amparo [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Yashchuk, Valeriy [Advanced Light Source, Lawrence Berkeley National Laboratory, MS 15-R0317, 1 Cyclotron Road, Berkeley, CA 94720-8199 (United States)

2016-04-20

DABAM, an open-source database of X-ray mirrors metrology to be used with ray-tracing and wave-propagation codes for simulating the effect of the surface errors on the performance of a synchrotron radiation beamline. An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal position in a beamline due to mirror surface errors. This database for metrology (DABAM) aims to provide to the users of simulation tools the data of real mirrors. The data included in the database are described in this paper, with details of how the mirror parameters are stored. An accompanying software is provided to allow simple access and processing of these data, calculate the most usual statistical parameters, and also include the option of creating input files for most used simulation codes. Some optics simulations are presented and discussed to illustrate the real use of the profiles from the database.

Performance of BICM-based QAM-SIM OWC over gamma-gamma turbulence channels

KAUST Repository

Malik, Muhammad Talha; Hossain, Md Jahangir; Cheng, Julian; Alouini, Mohamed-Slim

2015-01-01

We derive a series expression for the pair-wise error probability (PEP) of bit interleaved coded modulation (BICM)-based subcarrier intensity modulation (SIM) optical wireless communication (OWC) system employing M^{2}-ary quadrature amplitude

Machine tool metrology an industrial handbook

CERN Document Server

Smith, Graham T

2016-01-01

Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field. .

Coordinate Metrology by Traceable Computed Tomography

DEFF Research Database (Denmark)

Müller, Pavel

is an important factor for decision making about manufactured parts. However, due to many influences in CT, estimation of the uncertainty is a challenge, also because standardized procedures and guidelines are not available yet. In this thesis, several methods for uncertainty estimation were applied in connection......, characterization and correction of measurement errors in the CT volume. Their application appeared to be suitable for this task. Because the two objects consist of ruby spheres and carbon fibre, CT scans did not produce image artifacts, and evaluation of sphere-to-sphere distances was robust. Several methods...... metrology and coordinate metrology and is currently becoming more and more important measuring technique for dimensional measurements. This is mainly due to the fact that with CT, a complete three-dimensional model of the scanned part is in a relatively short time visualized using a computer...

Spectroscopic metrology for isotope composition measurements and transfer standards

Science.gov (United States)

Anyangwe Nwaboh, Javis; Balslev-Harder, David; Kääriäinen, Teemu; Richmond, Craig; Manninen, Albert; Mohn, Joachim; Kiseleva, Maria; Petersen, Jan C.; Werhahn, Olav; Ebert, Volker

2017-04-01

The World Meteorological Organization (WMO) has identified greenhouse gases such as CO2, CH4 and N2O as critical for global climate monitoring. Other molecules such as CO that has an indirect effect of enhancing global warming are also monitored. WMO has stated compatibility goals for atmospheric concentration and isotope ratio measurements of these gases, e.g. 0.1 ppm for CO2 concentration measurements in the northern hemisphere and 0.01 ‰ for δ13C-CO2. For measurements of the concentration of greenhouse gases, gas analysers are typically calibrated with static gas standards e.g. traceable to the WMO scale or to the International System of Units (SI) through a national metrology institute. However, concentrations of target components, e.g. CO, in static gas standards have been observed to drift, and typically the gas matrix as well as the isotopic composition of the target component does not always reflect field gas composition, leading to deviations of the analyser response, even after calibration. The deviations are dependent on the measurement technique. To address this issue, part of the HIGHGAS (Metrology for high-impact greenhouse gases) project [1] focused on the development of optical transfer standards (OTSs) for greenhouse gases, e.g. CO2 and CO, potentially complementing gas standards. Isotope ratio mass spectrometry (IRMS) [2] is currently used to provide state-of-the-art high precision (in the 0.01 ‰ range) measurements for the isotopic composition of greenhouse gases. However, there is a need for field-deployable techniques such as optical isotope ratio spectroscopy (OIRS) that can be combined with metrological measurement methods. Within the HIGHGAS project, OIRS methods and procedures based on e.g. cavity enhanced spectroscopy (CES) and tunable diode laser absorption spectroscopy (TDLAS), matched to metrological principles have been established for the measurement of 13C/12C and 18O/16O ratios in CO2, 15N/14N ratios in N2O, and 13C/12C and 2H

Getting Started with CoaSim — An Introduction to the Simulator CoaSim

DEFF Research Database (Denmark)

Mailund, T

2005-01-01

CoaSim is a tool for simulating the coalescent process with recombination and geneconversion, under either constant population size or exponential population growth. It effectively constructs the ancestral recombination graph for a given number of chromosomes and uses this to simulate samples...

Metrology and analytical chemistry: Bridging the cultural gap

International Nuclear Information System (INIS)

King, Bernard

2002-01-01

Metrology in general and issues such as traceability and measurement uncertainty in particular are new to most analytical chemists and many remain to be convinced of their value. There is a danger of the cultural gap between metrologists and analytical chemists widening with unhelpful consequences and it is important that greater collaboration and cross-fertilisation is encouraged. This paper discusses some of the similarities and differences in the approaches adopted by metrologists and analytical chemists and indicates how these approaches can be combined to establish a unique metrology of chemical measurement which could be accepted by both cultures. (author)

Improved capacity in ionizing radiation metrology at SANAEM

International Nuclear Information System (INIS)

Yucel, U.

2014-01-01

Full text : Turkey is planning to build nuclear power plants in the south and north coasts to supply the ever-increasing energy demand. The nuclear power plants based on old soviet technology in Armenia and Bulgaria close to Turkey's borders also makes constant monitoring of environmental radioactivity extremely important due to public health and environment contamination concerns. Radiation Metrology Division at SANAEM has been established in 2012 to provide uniformity and reliability of the measurements in the field of ionizing radiation metrology by R and D studies and by constituting, developing, keeping and extending internationally accepted reference measurement standards and techniques

Enabling CD SEM metrology for 5nm technology node and beyond

Science.gov (United States)

Lorusso, Gian Francesco; Ohashi, Takeyoshi; Yamaguchi, Astuko; Inoue, Osamu; Sutani, Takumichi; Horiguchi, Naoto; Bömmels, Jürgen; Wilson, Christopher J.; Briggs, Basoene; Tan, Chi Lim; Raymaekers, Tom; Delhougne, Romain; Van den Bosch, Geert; Di Piazza, Luca; Kar, Gouri Sankar; Furnémont, Arnaud; Fantini, Andrea; Donadio, Gabriele Luca; Souriau, Laurent; Crotti, Davide; Yasin, Farrukh; Appeltans, Raf; Rao, Siddharth; De Simone, Danilo; Rincon Delgadillo, Paulina; Leray, Philippe; Charley, Anne-Laure; Zhou, Daisy; Veloso, Anabela; Collaert, Nadine; Hasumi, Kazuhisa; Koshihara, Shunsuke; Ikota, Masami; Okagawa, Yutaka; Ishimoto, Toru

2017-03-01

The CD SEM (Critical Dimension Scanning Electron Microscope) is one of the main tools used to estimate Critical Dimension (CD) in semiconductor manufacturing nowadays, but, as all metrology tools, it will face considerable challenges to keep up with the requirements of the future technology nodes. The root causes of these challenges are not uniquely related to the shrinking CD values, as one might expect, but to the increase in complexity of the devices in terms of morphology and chemical composition as well. In fact, complicated threedimensional device architectures, high aspect ratio features, and wide variety of materials are some of the unavoidable characteristics of the future metrology nodes. This means that, beside an improvement in resolution, it is critical to develop a CD SEM metrology capable of satisfying the specific needs of the devices of the nodes to come, needs that sometimes will have to be addressed through dramatic changes in approach with respect to traditional CD SEM metrology. In this paper, we report on the development of advanced CD SEM metrology at imec on a variety of device platform and processes, for both logic and memories. We discuss newly developed approaches for standard, IIIV, and germanium FinFETs (Fin Field Effect Transistors), for lateral and vertical nanowires (NW), 3D NAND (three-dimensional NAND), STT-MRAM (Spin Transfer Magnetic Torque Random-Access Memory), and ReRAM (Resistive Random Access Memory). Applications for both front-end of line (FEOL) and back-end of line (BEOL) are developed. In terms of process, S/D Epi (Source Drain Epitaxy), SAQP (Self-Aligned Quadruple Patterning), DSA (Dynamic Self-Assembly), and EUVL (Extreme Ultraviolet Lithography) have been used. The work reported here has been performed on Hitachi CG5000, CG6300, and CV5000. In terms of logic, we discuss here the S/D epi defect classification, the metrology optimization for STI (Shallow Trench Isolation) Ge FinFETs, the defectivity of III-V STI Fin

A criterion of the performance of thermometric systems of high metrological reliability

International Nuclear Information System (INIS)

Sal'nikov, N.L.; Filimonov, E.V.

1995-01-01

Monitoring temperature regimes is an important part of ensuring the operational safety of a nuclear power plant. Therefore, high standards are imposed upon the reliability of the primary information on the heat field of the object obtained from different sensors, and it is urgent to develop methods of evaluating the metrological reliability of these sensors. THe main sources of thermometric information at nuclear power plants are contact temperature sensors, the most widely used of these being thermoelectric converters (TEC) and thermal resistance converters (TRC)

Radionuclide metrology research for nuclear site decommissioning

Science.gov (United States)

Judge, S. M.; Regan, P. H.

2017-11-01

The safe and cost-effective decommissioning of legacy nuclear sites relies on accurate measurement of the radioactivity content of the waste materials, so that the waste can be assigned to the most appropriate disposal route. Such measurements are a new challenge for the science of radionuclide metrology which was established largely to support routine measurements on operating nuclear sites and other applications such as nuclear medicine. In this paper, we provide a brief summary of the international measurement system that is established to enable nuclear site operators to demonstrate that measurements are accurate, independent and fit for purpose, and highlight some of the projects that are underway to adapt the measurement system to meet the changing demands from the industry.

Ionising radiation metrology for the metallurgical industry

Directory of Open Access Journals (Sweden)

García-Toraño E.

2014-01-01

Full Text Available Every year millions tons of steel are produced worldwide from recycled scrap loads. Although the detection systems in the steelworks prevent most orphan radioactive sources from entering the furnace, there is still the possibility of accidentally melting a radioactive source. The MetroMetal project, carried out in the frame of the European Metrology Research Programme (EMRP, addresses this problem by studying the existing measurement systems, developing sets of reference sources in various matrices (cast steel, slag, fume dust and proposing new detection instruments. This paper presents the key lines of the project and describes the preparation of radioactive sources as well as the intercomparison exercises used to test the calibration and correction methods proposed within the project.

Characteristics of the radiation prevention metrology laboratory 'Cajavec' - Banjaluka

International Nuclear Information System (INIS)

Tomljenovic, I.; Ninkovic, M.; Kolonic, Dz.

2004-01-01

Radiation metrology laboratory built in the factory 'Cajavec' in Banja Luka, planed for gauge the detectors of ionization radiation. Laboratory as part of the large factory building , thus projected and formed according to positive radiation principles. Walls are constructed of basic concrete, main entrance of lead, approaching the radiation bench from the back side. Sound and light signal system connected with dosemeter for showing mini dose of radiation creating conditions for safe work of the dosemeterists. (author) [sr

Manufacturing and metrology for IR conformal windows and domes

Science.gov (United States)

Ferralli, Ian; Blalock, Todd; Brunelle, Matt; Lynch, Timothy; Myer, Brian; Medicus, Kate

2017-05-01

Freeform and conformal optics have the potential to dramatically improve optical systems by enabling systems with fewer optical components, reduced aberrations, and improved aerodynamic performance. These optical components differ from standard components in their surface shape, typically a non-symmetric equation based definition, and material properties. Traditional grinding and polishing tools are unable to handle these freeform shapes. Additionally, standard metrology tools cannot measure these surfaces. Desired substrates are typically hard ceramics, including poly-crystalline alumina or aluminum oxynitride. Notwithstanding the challenges that the hardness provides to manufacturing, these crystalline materials can be highly susceptible to grain decoration creating unacceptable scatter in optical systems. In this presentation, we will show progress towards addressing the unique challenges of manufacturing conformal windows and domes. Particular attention is given to our robotic polishing platform. This platform is based on an industrial robot adapted to accept a wide range of tooling and parts. The robot's flexibility has provided us an opportunity to address the unique challenges of conformal windows. Slurries and polishing active layers can easily be changed to adapt to varying materials and address grain decoration. We have the flexibility to change tool size and shape to address the varying sizes and shapes of conformal optics. In addition, the robotic platform can be a base for a deflectometry-based metrology tool to measure surface form error. This system, whose precision is independent of the robot's positioning accuracy, will allow us to measure optics in-situ saving time and reducing part risk. In conclusion, we will show examples of the conformal windows manufactured using our developed processes.

Multispectral calibration to enhance the metrology performance of C-mount camera systems

Directory of Open Access Journals (Sweden)

S. Robson

2014-06-01

Full Text Available Low cost monochrome camera systems based on CMOS sensors and C-mount lenses have been successfully applied to a wide variety of metrology tasks. For high accuracy work such cameras are typically equipped with ring lights to image retro-reflective targets as high contrast image features. Whilst algorithms for target image measurement and lens modelling are highly advanced, including separate RGB channel lens distortion correction, target image circularity compensation and a wide variety of detection and centroiding approaches, less effort has been directed towards optimising physical target image quality by considering optical performance in narrow wavelength bands. This paper describes an initial investigation to assess the effect of wavelength on camera calibration parameters for two different camera bodies and the same ‘C-mount’ wide angle lens. Results demonstrate the expected strong influence on principal distance, radial and tangential distortion, and also highlight possible trends in principal point, orthogonality and affinity parameters which are close to the parameter estimation noise level from the strong convergent self-calibrating image networks.

DOE/NASA SIMS Prototype Solar System, no. 4. Part 1: Market analysis. Part 2: Modular manufacturing cost estimate

Science.gov (United States)

1979-01-01

The findings of the IIT Research Institute (IITRI) market study of the SIMS Prototype System 4, a hot water (DHW) system are documented. The feasibility of prepackaging currently available solar heating components into modular subsystems for site assembly is addressed. A documented design and installation procedure and a performance test report were prepared. The potential markets and applications for this particular system in the nonfederal market are profiled by assessing the needs and requirements of potential users and specifiers, by characterizing the nature of the market and the competitive environment, by identifying the barriers to commercial acceptance, and by estimating the size of the potential market.

ToF-SIMS measurements with topographic information in combined images.

Science.gov (United States)

Koch, Sabrina; Ziegler, Georg; Hutter, Herbert

2013-09-01

In 2D and 3D time-of-flight secondary ion mass spectrometric (ToF-SIMS) analysis, accentuated structures on the sample surface induce distorted element distributions in the measurement. The origin of this effect is the 45° incidence angle of the analysis beam, recording planar images with distortion of the sample surface. For the generation of correct element distributions, these artifacts associated with the sample surface need to be eliminated by measuring the sample surface topography and applying suitable algorithms. For this purpose, the next generation of ToF-SIMS instruments will feature a scanning probe microscope directly implemented in the sample chamber which allows the performance of topography measurements in situ. This work presents the combination of 2D and 3D ToF-SIMS analysis with topographic measurements by ex situ techniques such as atomic force microscopy (AFM), confocal microscopy (CM), and digital holographic microscopy (DHM). The concept of the combination of topographic and ToF-SIMS measurements in a single representation was applied to organic and inorganic samples featuring surface structures in the nanometer and micrometer ranges. The correct representation of planar and distorted ToF-SIMS images was achieved by the combination of topographic data with images of 2D as well as 3D ToF-SIMS measurements, using either AFM, CM, or DHM for the recording of topographic data.

Application of SIMS to the analysis of environmental samples

International Nuclear Information System (INIS)

Seyama, Haruhiko

2003-01-01

As an example of surface analysis of environmental samples, SIMS was applied to airborne particulates, fish otoliths (a calcareous ear-stone) and biotites (a rock-forming aluminosilicate mineral). Airborne particulates deposited on leaf surface were analyzed directly by fast atom bombardment (FAB)-SIMS using an O 2 primary neutral beam. Some metal elements, such as Pb, of aerosol origin could be detected. Local areas of a thin section of an otolith were analyzed by FAB-SIMS. Line scans and images of secondary ions revealed seasonal periodicity in Sr, Na and K concentrations in the otolith that corresponded to the annual band structure. Surface alteration of acid-treated and naturally weathered biotites was studied by SIMS depth profiling using an O - primary ion. The depth profile of the acid-treated biotite showed the formation of an altered surface layer rich in Si. In contrast a thick altered surface layer was not observed and Al was held on the surface under natural weathering

Functionality of novel black silicon based nanostructured surfaces studied by TOF SIMS

DEFF Research Database (Denmark)

Talian, Ivan; Aranyosiova, M.; Orinak, A.

2010-01-01

A functionality of the novel black silicon based nanostructured surfaces (BS 2) with different metal surface modifications was tested by time-of-flight secondary ion mass spectrometry (TOF SIMS). Mainly two surface functions were studied: analytical signal enhancement and analyte pre-ionization e......A functionality of the novel black silicon based nanostructured surfaces (BS 2) with different metal surface modifications was tested by time-of-flight secondary ion mass spectrometry (TOF SIMS). Mainly two surface functions were studied: analytical signal enhancement and analyte pre......-ionization effect in SIMS due to nanostructure type and the assistance of the noble metal surface coating (Ag or Au) for secondary ion formation. As a testing analyte a Rhodamine 6G was applied. Bi+ has been used as SIMS primary ions. It was found out that SIMS signal enhancement of the analyte significantly...... depends on Ag layer thickness and measured ion mode (negative, positive). The best SIMS signal enhancement was obtained at BS2 surface coated with 400 nm of Ag layer. SIMS fragmentation schemes were developed for a model analyte deposited onto a silver and gold surface. Significant differences in pre...

Methodological development of topographic correction in 2D/3D ToF-SIMS images using AFM images

Science.gov (United States)

Jung, Seokwon; Lee, Nodo; Choi, Myungshin; Lee, Jungmin; Cho, Eunkyunng; Joo, Minho

2018-02-01

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an emerging technique that provides chemical information directly from the surface of electronic materials, e.g. OLED and solar cell. It is very versatile and highly sensitive mass spectrometric technique that provides surface molecular information with their lateral distribution as a two-dimensional (2D) molecular image. Extending the usefulness of ToF-SIMS, a 3D molecular image can be generated by acquiring multiple 2D images in a stack. These imaging techniques by ToF-SIMS provide an insight into understanding the complex structures of unknown composition in electronic material. However, one drawback in ToF-SIMS is not able to represent topographical information in 2D and 3D mapping images. To overcome this technical limitation, topographic information by ex-situ technique such as atomic force microscopy (AFM) has been combined with chemical information from SIMS that provides both chemical and physical information in one image. The key to combine two different images obtained from ToF-SIMS and AFM techniques is to develop the image processing algorithm, which performs resize and alignment by comparing the specific pixel information of each image. In this work, we present methodological development of the semiautomatic alignment and the 3D structure interpolation system for the combination of 2D/3D images obtained by ToF-SIMS and AFM measurements, which allows providing useful analytical information in a single representation.

In-line CD metrology with combined use of scatterometry and CD-SEM

Science.gov (United States)

Asano, Masafumi; Ikeda, Takahiro; Koike, Toru; Abe, Hideaki

2006-03-01

Measurement characteristics in scatterometry and CD-SEM for lot acceptance sampling of inline critical dimension (CD) metrology were investigated by using a statistical approach with Monte Carlo simulation. By operation characteristics curve analysis, producer's risk and consumer's risk arising from sampling were clarified. Single use of scatterometry involves a higher risk, such risk being particularly acute in the case of large intra-chip CD variation because it is unable to sufficiently monitor intra-chip CD variation including local CD error. Substituting scatterometry for conventional SEM metrology is accompanied with risks, resulting in the increase of unnecessary cost. The combined use of scatterometry and SEM metrology in which the sampling plan for SEM is controlled by scatterometry is a promising metrology from the viewpoint of the suppression of risks and cost. This is due to the effect that CD errors existing in the distribution tails are efficiently caught.

Development practices and lessons learned in developing SimPEG

Science.gov (United States)

Cockett, R.; Heagy, L. J.; Kang, S.; Rosenkjaer, G. K.

2015-12-01

Inverse modelling provides a mathematical framework for constructing a model of physical property distributions in the subsurface that are consistent with the data collected in geophysical surveys. The geosciences are increasingly moving towards the integration of geological, geophysical, and hydrological information to better characterize the subsurface. This integration must span disciplines and is not only challenging scientifically, but additionally the inconsistencies between conventions often makes implementations complicated, non­ reproducible, or inefficient. SimPEG is an open-source, multi-university effort aimed at providing a generalized framework for solving forward and inverse problems. SimPEG includes finite volume discretizations on structured and unstructured meshes, interfaces to standard numerical solver packages, convex optimization algorithms, model parameterizations, and visualization routines. The SimPEG package (http://simpeg.xyz) supports an ecosystem of forward and inverse modelling applications, including electromagnetics, vadose zone flow, seismic, and potential­ fields, that are all written with a common interface and toolbox. The goal of SimPEG is to support a community of researchers with well-tested, extensible tools, and encourage transparency and reproducibility both of the SimPEG software and the geoscientific research it is applied to. In this presentation, we will share some of the lessons we have learned in designing the modular infrastructure, testing and development practices of SimPEG. We will discuss our use of version control, extensive unit-testing, continuous integration, documentation, issue tracking, and resources that facilitate communication between existing team members and allows new researchers to get involved. These practices have enabled the use of SimPEG in research, industry, and education as well as the ability to support a growing number of dependent repositories and applications. We hope that sharing our

Analysis of impurities in semiconductor by IMA (SIMS)

International Nuclear Information System (INIS)

Komori, Junko; Masuko, Yoji; Koyama, Hiroshi

1988-01-01

The report outlines the measuring mechanism of SIMS and its applications in the field of semiconductor production. SIMS is the only equipment currently available for micrometer-order analysis and ppb-level impurities detection required for evaluation of semiconductors. In SIMS, sputtering of the sample surface is performed with primary ions and the secondary ions released from the sample are analyzed to identify the atomic species existing in the surface. The sputtering process and ionization process are outlined in the report, though the details of sputtering has not been fully clarified yet. In actual observation, some problems may be caused due to interfering ions and residual ions. In general, various ions including multi-valent ions, cluster ions, molecular ions, hydrogenated/oxygenated ions and hydrocarbon ions are produced in addition to monovalent ions to interfere the atoms under analysis. Interference by these ions can cause serious problems in carrying out depth profile analysis as well as observation of mass spectra. Major applications of SIMS in the field of semiconductor production include the evaluation of silicon surface, light elements, insulating materials and semiconductor devices. Some requirements to be met by further studies are also listed. (N.K.)

The Act of 17 March 2000 on metrology and on changes and amendments of some acts

International Nuclear Information System (INIS)

2000-01-01

This act metrology for organization of unity and correctness of mensuration adapts (a) the law measurement units, (b) the requests on committed gauges and their metrological control, (c) the conditions of official mensuration, (d) the requests on consumptive packages articles; (e) the conditions of authorization and registration, (f) operation of organs of the state administration for metrology, (g) the metrological authority (h) putting of fines. This act shall into effect on 1 July 2000

Optical metrology techniques for dimensional stability measurements

NARCIS (Netherlands)

Ellis, Jonathan David

2010-01-01

This thesis work is optical metrology techniques to determine material stability. In addition to displacement interferometry, topics such as periodic nonlinearity, Fabry-Perot interferometry, refractometry, and laser stabilization are covered.

Ensuring Food Integrity by Metrology and FAIR Data Principles

Directory of Open Access Journals (Sweden)

Michael Rychlik

2018-05-01

Full Text Available Food integrity is a general term for sound, nutritive, healthy, tasty, safe, authentic, traceable, as well as ethically, safely, environment-friendly, and sustainably produced foods. In order to verify these properties, analytical methods with a higher degree of accuracy, sensitivity, standardization and harmonization and a harmonized system for their application in analytical laboratories are required. In this view, metrology offers the opportunity to achieve these goals. In this perspective article the current global challenges in food analysis and the principles of metrology to fill these gaps are presented. Therefore, the pan-European project METROFOOD-RI within the framework of the European Strategy Forum on Research Infrastructures (ESFRI was developed to establish a strategy to allow reliable and comparable analytical measurements in foods along the whole process line starting from primary producers until consumers and to make all data findable, accessible, interoperable, and re-usable according to the FAIR data principles. The initiative currently consists of 48 partners from 18 European Countries and concluded its “Early Phase” as research infrastructure by organizing its future structure and presenting a proof of concept by preparing, distributing and comprehensively analyzing three candidate Reference Materials (rice grain, rice flour, and oyster tissue and establishing a system how to compile, process, and store the generated data and how to exchange, compare them and make them accessible in data bases.

Editorial: 3DIM-DS 2015: Optical image processing in the context of 3D imaging, metrology, and data security

Science.gov (United States)

Alfalou, Ayman

2017-02-01

Following the first International Symposium on 3D Imaging, Metrology, and Data Security (3DIM-DS) held in Shenzhen during september 2015, this special issue gathers a series of articles dealing with the main topics discussed during this symposium. These topics highlighted the importance of studying complex data treatment systems and intensive calculations designed for high dimensional imaging and metrology for which high image quality and high transmission speed become critical issues in a number of technological applications. A second purpose was to celebrate the International Year of Light by emphasizing the important role of optics in actual information processing systems.

Scanner image methodology (SIM) to measure dimensions of leaves ...

African Journals Online (AJOL)

A scanner image methodology was used to determine plant dimensions, such as leaf area, length and width. The values obtained using SIM were compared with those recorded by the LI-COR leaf area meter. Bias, linearity, reproducibility and repeatability (R&R) were evaluated for SIM. Different groups of leaves were ...

Scientific language and metrology; El lenguaje cientificio y la metrologia

Energy Technology Data Exchange (ETDEWEB)

Campo Maldonado, D. del; Martin Blasco, B.; Prieto Esteban, E.

2011-07-01

The International System of Units (SI) reflects all the decisions and recommendations regarding units of measurement issued by the General Conference on Weights and Measures, including rules for writing the names and symbols of measurement units and for expressing the values of quantities. Even though the SI is internationally accepted and is the declared legal system whose use is obligatory in Spain, the Spanish Metrology Centre has been detecting an incorrect use of the units of measurement both in textbooks at all levels and in scientific articles. (Author) 5 refs.

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy.

Science.gov (United States)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

2016-05-01

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or "tophat" beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

Secondary ion mass spectroscopy (SIMS)

International Nuclear Information System (INIS)

Naik, P.K.

1975-01-01

Secondary Ion Mass Spectrometry (SIMS) which is primarily a method for investigating the chemical composition of the uppermost atomic layer of solid surfaces is explained. In this method, the specimen is bombarded with a primary positive ion beam of small current density monolayer. Positive and negative ions sputtered from the specimen are mass analysed to give the surface chemical composition. The analytical system which consists of a primary ion source, a target manipulator and a mass spectrometer housed in an ultrahigh vacuum system is described. This method can also be used for profile measurements in thin films by using higher current densities of the primary ions. Fields of application such as surface reactions, semiconductors, thin films emission processes, chemistry, metallurgy are touched upon. Various aspects of this method such as the sputtering process, instrumentation, and applications are discussed. (K.B.)

Metrological assurance and traceability for Industry 4.0 and additive manufacturing in Ukraine

Science.gov (United States)

Skliarov, Volodymyr; Neyezhmakov, Pavel; Prokopov, Alexander

2018-03-01

The national measurement standards from the point of view of traceability of the results of measurement in additive manufacturing in Ukraine are considered in the paper. The metrological characteristics of the national primary measurement standards in the field of geometric, temperature, optical-physical and time-frequency measurements, which took part in international comparisons within COOMET projects, are presented. The accurate geometric, temperature, optical-physical and time-frequency measurements are the key ones in controlling the quality of additive manufacturing. The use of advanced CAD/CAE/CAM systems allows to simulate the process of additive manufacturing at each stage. In accordance with the areas of the technology of additive manufacturing, the ways of improving the national measurement standards of Ukraine for the growing needs of metrology of additive manufacturing are considered.

Metrology measurements for large-aperture VPH gratings

Science.gov (United States)

Zheng, Jessica R.; Gers, Luke; Heijmans, Jeroen

2013-09-01

The High Efficiency and Resolution Multi Element Spectrograph (HERMES) for the Australian Astronomical Observatory (AAO) uses four large aperture, high angle of incidence volume phase holographic gratings (VPHG) for high resolution `Galactic archaeology' spectroscopy. The large clear aperture, the high diffraction efficiency, the line frequency homogeneity, and mosaic alignment made manufacturing and testing challenging. We developed new metrology systems at the AAO to verify the performance of these VPH gratings. The measured diffraction efficiencies and line frequency of the VPH gratings received so far meet the vendor's provided data. The wavefront quality for the Blue VPH grating is good but the Green and Red VPH gratings need to be post polishing.

Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

Science.gov (United States)

Wang, Hongchang; Zhou, Tunhe; Kashyap, Yogesh; Sawhney, Kawal

2017-08-01

To achieve high resolution and sensitivity on the nanometer scale, further development of X-ray optics is required. Although ex-situ metrology provides valuable information about X-ray optics, the ultimate performance of X-ray optics is critically dependent on the exact nature of the working conditions. Therefore, it is equally important to perform in-situ metrology at the optics' operating wavelength (`at-wavelength' metrology) to optimize the performance of X-ray optics and correct and minimize the collective distortions of the upstream beamline optics, e.g. monochromator, windows, etc. Speckle-based technique has been implemented and further improved at Diamond Light Source. We have demonstrated that the angular sensitivity for measuring the slope error of an optical surface can reach an accuracy of two nanoradians. The recent development of the speckle-based at-wavelength metrology techniques will be presented. Representative examples of the applications of the speckle-based technique will also be given - including optimization of X-ray mirrors and characterization of compound refraction lenses. Such a high-precision metrology technique will be extremely beneficial for the manufacture and in-situ alignment/optimization of X-ray mirrors for next-generation synchrotron beamlines.

Face-based recognition techniques: proposals for the metrological characterization of global and feature-based approaches

Science.gov (United States)

Betta, G.; Capriglione, D.; Crenna, F.; Rossi, G. B.; Gasparetto, M.; Zappa, E.; Liguori, C.; Paolillo, A.

2011-12-01

Security systems based on face recognition through video surveillance systems deserve great interest. Their use is important in several areas including airport security, identification of individuals and access control to critical areas. These systems are based either on the measurement of details of a human face or on a global approach whereby faces are considered as a whole. The recognition is then performed by comparing the measured parameters with reference values stored in a database. The result of this comparison is not deterministic because measurement results are affected by uncertainty due to random variations and/or to systematic effects. In these circumstances the recognition of a face is subject to the risk of a faulty decision. Therefore, a proper metrological characterization is needed to improve the performance of such systems. Suitable methods are proposed for a quantitative metrological characterization of face measurement systems, on which recognition procedures are based. The proposed methods are applied to three different algorithms based either on linear discrimination, on eigenface analysis, or on feature detection.

Face-based recognition techniques: proposals for the metrological characterization of global and feature-based approaches

International Nuclear Information System (INIS)

Betta, G; Capriglione, D; Crenna, F; Rossi, G B; Gasparetto, M; Zappa, E; Liguori, C; Paolillo, A

2011-01-01

Security systems based on face recognition through video surveillance systems deserve great interest. Their use is important in several areas including airport security, identification of individuals and access control to critical areas. These systems are based either on the measurement of details of a human face or on a global approach whereby faces are considered as a whole. The recognition is then performed by comparing the measured parameters with reference values stored in a database. The result of this comparison is not deterministic because measurement results are affected by uncertainty due to random variations and/or to systematic effects. In these circumstances the recognition of a face is subject to the risk of a faulty decision. Therefore, a proper metrological characterization is needed to improve the performance of such systems. Suitable methods are proposed for a quantitative metrological characterization of face measurement systems, on which recognition procedures are based. The proposed methods are applied to three different algorithms based either on linear discrimination, on eigenface analysis, or on feature detection

SIMS analysis of extended impact features on LDEF experiment

Science.gov (United States)

Amari, S.; Foote, J.; Jessberger, E. K.; Simon, C.; Stadermann, F. J.; Swan, P.; Walker, R.; Zinner, E.

1991-01-01

Discussed here are the first Secondary Ion Mass Spectroscopy (SIMS) analysis of projectile material deposited in extended impact features on Ge wafers from the trailing edge. Although most capture cells lost their plastic film covers, they contain extended impact features that apparently were produced by high velocity impacts when the plastic foils were still intact. Detailed optical scanning of all bare capture cells from the trailing edge revealed more than 100 impacts. Fifty-eight were selected by scanning electron microscope (SEM) inspection as prime candidates for SIMS analysis. Preliminary SIMS measurements were made on 15 impacts. More than half showed substantial enhancements of Mg, Al, Si, Ca, and Fe in the impact region, indicating micrometeorites as the projectiles.

Crystallization and preliminary X-ray analysis of the TetR-like efflux pump regulator SimR

International Nuclear Information System (INIS)

Le, Tung B. K.; Stevenson, Clare E. M.; Buttner, Mark J.; Lawson, David M.

2011-01-01

Crystals of SimR, a TetR-like efflux pump repressor from S. antibioticus, were obtained and X-ray data were recorded to a resolution of 2.3 Å. Crystals of SimR were grown by vapour diffusion. The protein crystallized with trigonal symmetry and X-ray data were recorded to a resolution of 2.3 Å from a single crystal at the synchrotron. SimR belongs to the TetR family of bacterial transcriptional regulators. In the absence of the antibiotic simocyclinone, SimR represses the transcription of a divergently transcribed gene encoding the simocyclinone efflux pump SimX in Streptomyces antibioticus by binding to operators in the simR–simX intergenic region. Simocyclinone binding causes SimR to dissociate from its operators, leading to expression of the SimX efflux pump. Thus, SimR represents an intimate link between the biosynthesis of simocyclinone and its export, which may also provide the mechanism of self-resistance to the antibiotic in the producer strain

Multi-dimensional TOF-SIMS analysis for effective profiling of disease-related ions from the tissue surface.

Science.gov (United States)

Park, Ji-Won; Jeong, Hyobin; Kang, Byeongsoo; Kim, Su Jin; Park, Sang Yoon; Kang, Sokbom; Kim, Hark Kyun; Choi, Joon Sig; Hwang, Daehee; Lee, Tae Geol

2015-06-05

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) emerges as a promising tool to identify the ions (small molecules) indicative of disease states from the surface of patient tissues. In TOF-SIMS analysis, an enhanced ionization of surface molecules is critical to increase the number of detected ions. Several methods have been developed to enhance ionization capability. However, how these methods improve identification of disease-related ions has not been systematically explored. Here, we present a multi-dimensional SIMS (MD-SIMS) that combines conventional TOF-SIMS and metal-assisted SIMS (MetA-SIMS). Using this approach, we analyzed cancer and adjacent normal tissues first by TOF-SIMS and subsequently by MetA-SIMS. In total, TOF- and MetA-SIMS detected 632 and 959 ions, respectively. Among them, 426 were commonly detected by both methods, while 206 and 533 were detected uniquely by TOF- and MetA-SIMS, respectively. Of the 426 commonly detected ions, 250 increased in their intensities by MetA-SIMS, whereas 176 decreased. The integrated analysis of the ions detected by the two methods resulted in an increased number of discriminatory ions leading to an enhanced separation between cancer and normal tissues. Therefore, the results show that MD-SIMS can be a useful approach to provide a comprehensive list of discriminatory ions indicative of disease states.

Regional metrology organisations and the JCRB

International Nuclear Information System (INIS)

Hetherington, Paul

2004-01-01

In 1999, National Metrology Institutes (NMIs) from some 39 countries signed the International Committee of Weights and Measures (CIPM) Mutual Recognition Arrangement (MRA) in Paris. The MRA, drawn up by the CIPM, under the authority given to it in the Metre Convention, was in response to requirements of Governments and Regulators to provide a sound technical foundation for trade agreements. Core objectives of the MRA are to allow for the establishment of the degree of equivalence of national measurement standards and to provide for mutual recognition of calibration certificates issued by NMIs. This presentation will detail the evolution of the MRA. Globally, NMIs are affiliated to Regional Metrology Organisations (RMOs). The key role of the RMOs in the MRA process will be discussed along with the structure and objectives of the various RMOs worldwide. The Joint Committee of the RMOs and the BIPM (JCRB) plays a central part in the effective operation of the MRA. Its tasks, membership and output will also be described

PREFACE: Fundamental Constants in Physics and Metrology

Science.gov (United States)

Klose, Volkmar; Kramer, Bernhard

1986-01-01

This volume contains the papers presented at the 70th PTB Seminar which, the second on the subject "Fundamental Constants in Physics and Metrology", was held at the Physikalisch-Technische Bundesanstalt in Braunschweig from October 21 to 22, 1985. About 100 participants from the universities and various research institutes of the Federal Republic of Germany participated in the meeting. Besides a number of review lectures on various broader subjects there was a poster session which contained a variety of topical contributed papers ranging from the theory of the quantum Hall effect to reports on the status of the metrological experiments at the PTB. In addition, the participants were also offered the possibility to visit the PTB laboratories during the course of the seminar. During the preparation of the meeting we noticed that even most of the general subjects which were going to be discussed in the lectures are of great importance in connection with metrological experiments and should be made accessible to the scientific community. This eventually resulted in the idea of the publication of the papers in a regular journal. We are grateful to the editor of Metrologia for providing this opportunity. We have included quite a number of papers from basic physical research. For example, certain aspects of high-energy physics and quantum optics, as well as the many-faceted role of Sommerfeld's fine-structure constant, are covered. We think that questions such as "What are the intrinsic fundamental parameters of nature?" or "What are we doing when we perform an experiment?" can shed new light on the art of metrology, and do, potentially, lead to new ideas. This appears to be especially necessary when we notice the increasing importance of the role of the fundamental constants and macroscopic quantum effects for the definition and the realization of the physical units. In some cases we have reached a point where the limitations of our knowledge of a fundamental constant and

Metrology requirements for the serial production of ELT primary mirror segments

Science.gov (United States)

Rees, Paul C. T.; Gray, Caroline

2015-08-01

The manufacture of the next generation of large astronomical telescopes, the extremely large telescopes (ELT), requires the rapid manufacture of greater than 500 1.44m hexagonal segments for the primary mirror of each telescope. Both leading projects, the Thirty Meter Telescope (TMT) and the European Extremely Large Telescope (E-ELT), have set highly demanding technical requirements for each fabricated segment. These technical requirements, when combined with the anticipated construction schedule for each telescope, suggest that more than one optical fabricator will be involved in the delivery of the primary mirror segments in order to meet the project schedule. For one supplier, the technical specification is challenging and requires highly consistent control of metrology in close coordination with the polishing technologies used in order to optimize production rates. For production using multiple suppliers, however the supply chain is structured, consistent control of metrology along the supply chain will be required. This requires a broader pattern of independent verification than is the case of a single supplier. This paper outlines the metrology requirements for a single supplier throughout all stages of the fabrication process. We identify and outline those areas where metrology accuracy and duration have a significant impact on production efficiency. We use the challenging ESO E-ELT technical specification as an example of our treatment, including actual process data. We further develop this model for the case of a supply chain consisting of multiple suppliers. Here, we emphasize the need to control metrology throughout the supply chain in order to optimize net production efficiency.

Sub-atomic dimensional metrology: developments in the control of x-ray interferometers

Science.gov (United States)

Yacoot, Andrew; Kuetgens, Ulrich

2012-07-01

Within the European Metrology Research Programme funded project NANOTRACE, the nonlinearity of the next generation of optical interferometers has been measured using x-ray interferometry. The x-ray interferometer can be regarded as a ruler or translation stage whose graduations or displacement steps are based on the lattice spacing of the crystallographic planes from which the x-rays are diffracted: in this case the graduations are every 192 pm corresponding to the spacing between the (2 2 0) planes in silicon. Precise displacement of the x-ray interferometer's monolithic translation stage in steps corresponding to discrete numbers of x-ray fringes requires servo positioning capability at the picometre level. To achieve this very fine control, a digital control system has been developed which has opened up the potential for advances in metrology using x-ray interferometry that include quadrature counting of x-ray fringes.

Sub-atomic dimensional metrology: developments in the control of x-ray interferometers

International Nuclear Information System (INIS)

Yacoot, Andrew; Kuetgens, Ulrich

2012-01-01

Within the European Metrology Research Programme funded project NANOTRACE, the nonlinearity of the next generation of optical interferometers has been measured using x-ray interferometry. The x-ray interferometer can be regarded as a ruler or translation stage whose graduations or displacement steps are based on the lattice spacing of the crystallographic planes from which the x-rays are diffracted: in this case the graduations are every 192 pm corresponding to the spacing between the (2 2 0) planes in silicon. Precise displacement of the x-ray interferometer's monolithic translation stage in steps corresponding to discrete numbers of x-ray fringes requires servo positioning capability at the picometre level. To achieve this very fine control, a digital control system has been developed which has opened up the potential for advances in metrology using x-ray interferometry that include quadrature counting of x-ray fringes. (paper)

Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility

Science.gov (United States)

Tadić, Tonči; Bogdanović Radović, Iva; Siketić, Zdravko; Cosic, Donny Domagoj; Skukan, Natko; Jakšić, Milko; Matsuo, Jiro

2014-08-01

We describe a new Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) setup for MeV SIMS application, which is constructed and installed at the heavy ion microbeam facility at the Ruđer Bošković Institute in Zagreb. The TOF-SIMS setup is developed for high sensitivity molecular imaging using a heavy ion microbeam that focuses ion beams (from C to I) with sub-micron resolution. Dedicated pulse processing electronics for MeV SIMS application have been developed, enabling microbeam-scanning control, incoming ion microbeam pulsing and molecular mapping. The first results showing measured MeV SIMS spectra as well as molecular maps for samples of interest are presented and discussed.

Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility

International Nuclear Information System (INIS)

Tadić, Tonči; Bogdanović Radović, Iva; Siketić, Zdravko; Cosic, Donny Domagoj; Skukan, Natko; Jakšić, Milko; Matsuo, Jiro

2014-01-01

We describe a new Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) setup for MeV SIMS application, which is constructed and installed at the heavy ion microbeam facility at the Ruđer Bošković Institute in Zagreb. The TOF-SIMS setup is developed for high sensitivity molecular imaging using a heavy ion microbeam that focuses ion beams (from C to I) with sub-micron resolution. Dedicated pulse processing electronics for MeV SIMS application have been developed, enabling microbeam-scanning control, incoming ion microbeam pulsing and molecular mapping. The first results showing measured MeV SIMS spectra as well as molecular maps for samples of interest are presented and discussed

Fabrication, performance, and figure metrology of epoxy-replicated aluminum foils for hard x-ray focusing multilayer-coated segmented conical optics

DEFF Research Database (Denmark)

Jimenez-Garate, M.A.; Craig, W.W.; Hailey, C.J.

2000-01-01

We fabricated x-ray mirrors for hard x-ray (greater than or equal to 10 keV) telescopes using multilayer coatings and an improved epoxy-replicated aluminum foil (ERAF) nonvacuum technology. The ERAF optics have similar to1 arcmin axial figure half-power diameter (HPD) and passed environmental...... telescope HPD, we designed a figure metrology system and a new mounting technique. We describe a cylindrical metrology system built for fast axial and roundness figure measurement of hard x-ray conical optics. These developments lower cost and improve the optics performance of the HEFT (high-energy focusing...

Metrological traceability of holmium oxide solution

Science.gov (United States)

Gonçalves, D. E. F.; Gomes, J. F. S.; Alvarenga, A. P. D.; Borges, P. P.; Araujo, T. O.

2018-03-01

Holmium oxide solution was prepared as a candidate of certified reference material for spectrophotometer wavelength scale calibration. Here is presented the necessary steps for evaluation of the uncertainty and the establishment of metrological traceability for the production of this material. Preliminary results from the first produced batch are shown.

Issues of Teaching Metrology in Higher Education Institutions of Civil Engineering in Russia

Science.gov (United States)

Pukharenko, Yurii Vladimirovich; Norin, Veniamin Aleksandrovich

2017-01-01

The work analyses the training process condition in teaching the discipline "Metrology, Standardization, Certification and Quality Control." It proves that the current educational standard regarding the instruction of the discipline "Metrology, Standardization, Certification and Quality Control" does not meet the needs of the…

Quantum interference metrology at deep-UV wavelengths using phase-controlled ultrashort laser pulses

NARCIS (Netherlands)

Zinkstok, R. Th; Witte, S.; Ubachs, W.; Hogervorst, W.; Eikema, K. S E

2005-01-01

High-resolution metrology at wavelengths shorter than ultraviolet is in general hampered by a limited availability of appropriate laser sources. It is demonstrated that this limitation can be overcome by quantum-interference metrology with frequency up-converted ultrafast laser pulses. The required

The core competencies of James Marion Sims, MD.

Science.gov (United States)

Straughn, J Michael; Gandy, Roy E; Rodning, Charles B

2012-07-01

The concept of core competencies in graduate medical education was introduced by the Accreditation Council for Graduate Medical Education of the American Medical Association to semiquantitatively assess the professional performance of students, residents, practitioners, and faculty. Many aspects of the career of J. Marion Sims, MD, are exemplary of those core competencies: MEDICAL KNOWLEDGE: Author of the first American textbook related to gynecology. MEDICAL CARE: Innovator of the Sims' Vaginal Speculum, Sims' Position, Sims' Test, and vesico-/rectovaginal fistulorrhaphy; advocated abdominal exploration for penetrating wounds; performed the first cholecystostomy. PROFESSIONALISM: Served as President of the New York Academy of Medicine, the American Medical Association, and the American Gynecologic Society. INTERPERSONAL RELATIONSHIPS/COMMUNICATION: Cared for the indigent, hearthless, indentured, disenfranchised; served as consulting surgeon to the Empress Eugénie (France), the Duchess of Hamilton (Scotland), the Empress of Austria, and other royalty of the aristocratic Houses of Europe; accorded the National Order of the Legion of Honor. PRACTICE-BASED LEARNING: Introduction of silver wire sutures; adoption of the principles of asepsis/antisepsis; adoption of the principles of general anesthesia. SYSTEMS-BASED PRACTICE: Established the Woman's Hospital, New York City, New York, the predecessor of the Memorial Sloan-Kettering Center for the Treatment of Cancer and Allied Diseases; organized the Anglo-American Ambulance Corps under the patronage of Napoleon III. What led him to a life of clinical and humanitarian service? First, he was determined to succeed. His formal medical/surgical education was perhaps the best available to North Americans during that era. Second, he was courageous in experimentation and innovation, applying new developments in operative technique, asepsis/antisepsis, and general anesthesia. Third, his curiosity was not burdened by rigid

PLA-PMMA blends: A study by XPS and ToF-SIMS

International Nuclear Information System (INIS)

Cossement, D.; Gouttebaron, R.; Cornet, V.; Viville, P.; Hecq, M.; Lazzaroni, R.

2006-01-01

This paper reports which are the possibilities of quantification by time of flight secondary ion mass spectrometry (ToF-SIMS) for some polymer blends. In order to assess the composition of the mixtures, we studied first different poly(L-lactide)/polymethylmethacrylate (PLA/PMMA) blends by X-ray photoelectron spectroscopy (XPS), this technique being quantitative. By XPS fitting of the C 1s level, we found a very good agreement of the measured concentrations with the initial compositions. Concerning ToF-SIMS data treatment, we used principal component analysis (PCA) on negative spectra allowing to discriminate one polymer from the other one. By partial least square regression (PLS), we found also a good agreement between the ToF-SIMS predicted and initial compositions. This shows that ToF-SIMS, in a similar way to XPS, can lead to quantitative results. In addition, the observed agreement between XPS (60-100 A depth analyzed) and ToF-SIMS (10 A depth analyzed) measurements show that there is no segregation of one of the two polymers onto the surface

Scanner focus metrology and control system for advanced 10nm logic node

Science.gov (United States)

Oh, Junghun; Maeng, Kwang-Seok; Shin, Jae-Hyung; Choi, Won-Woong; Won, Sung-Keun; Grouwstra, Cedric; El Kodadi, Mohamed; Heil, Stephan; van der Meijden, Vidar; Hong, Jong Kyun; Kim, Sang-Jin; Kwon, Oh-Sung

2018-03-01

Immersion lithography is being extended beyond the 10-nm node and the lithography performance requirement needs to be tightened further to ensure good yield. Amongst others, good on-product focus control with accurate and dense metrology measurements is essential to enable this. In this paper, we will present new solutions that enable onproduct focus monitoring and control (mean and uniformity) suitable for high volume manufacturing environment. We will introduce the concept of pure focus and its role in focus control through the imaging optimizer scanner correction interface. The results will show that the focus uniformity can be improved by up to 25%.

SORCE SIM Level 3 Solar Spectral Irradiance Daily Means V020

Data.gov (United States)

National Aeronautics and Space Administration — The SORCE SIM Solar Spectral Irradiance (SSI) data product SOR3SIMD is constructed using measurements from the SIM instruments, which are combined into merged daily...

SORCE SIM Level 3 Solar Spectral Irradiance Daily Means V022

Data.gov (United States)

National Aeronautics and Space Administration — The SORCE SIM Solar Spectral Irradiance (SSI) data product SOR3SIMD is constructed using measurements from the SIM instruments, which are combined into merged daily...

Metrology of radiation protection. Pt. 1. Physical requirements and terminology

Energy Technology Data Exchange (ETDEWEB)

Wagner, S R

1979-10-01

Starting from a general consideration of the needs for radiation protection the physical requirements of a relevant metrology are developed. The expedient physical quantities are introduced and problems in the realization and dissemination of their units discussed. It is shown that owing to these difficulties, derived or operational quantities have to be developed for the construction and calibration of practical measuring instruments. Finally the relations between the metrology of radiation protection and of medical radiology are pointed out and commented. (orig.).

Forum metrology 2009: control of optics, targets and optical analyzers

International Nuclear Information System (INIS)

Desenne, D.; Andre, R.

2010-01-01

The 1. 'Forum Metrologie' of the CEA/DAM has been held in the 'Institut Laser et Plasma' on the December 9, 2009, close to the 'Centre d'etudes Scientifiques et Techniques d'Aquitaine'. It has been set up by the 'Departement Lasers de Puissance'. The chosen thematic was the metrology around laser experiments, with a special focus on the metrology of the dedicated optics, targets and optical analysers. The talks have shown the progress and difficulties in each of these fields. (authors)

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

International Nuclear Information System (INIS)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

2016-01-01

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

Energy Technology Data Exchange (ETDEWEB)

Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal, E-mail: kawal.sawhney@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

2016-05-15

X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

IntNetLncSim: an integrative network analysis method to infer human lncRNA functional similarity.

Science.gov (United States)

Cheng, Liang; Shi, Hongbo; Wang, Zhenzhen; Hu, Yang; Yang, Haixiu; Zhou, Chen; Sun, Jie; Zhou, Meng

2016-07-26

Increasing evidence indicated that long non-coding RNAs (lncRNAs) were involved in various biological processes and complex diseases by communicating with mRNAs/miRNAs each other. Exploiting interactions between lncRNAs and mRNA/miRNAs to lncRNA functional similarity (LFS) is an effective method to explore function of lncRNAs and predict novel lncRNA-disease associations. In this article, we proposed an integrative framework, IntNetLncSim, to infer LFS by modeling the information flow in an integrated network that comprises both lncRNA-related transcriptional and post-transcriptional information. The performance of IntNetLncSim was evaluated by investigating the relationship of LFS with the similarity of lncRNA-related mRNA sets (LmRSets) and miRNA sets (LmiRSets). As a result, LFS by IntNetLncSim was significant positively correlated with the LmRSet (Pearson correlation γ2=0.8424) and LmiRSet (Pearson correlation γ2=0.2601). Particularly, the performance of IntNetLncSim is superior to several previous methods. In the case of applying the LFS to identify novel lncRNA-disease relationships, we achieved an area under the ROC curve (0.7300) in experimentally verified lncRNA-disease associations based on leave-one-out cross-validation. Furthermore, highly-ranked lncRNA-disease associations confirmed by literature mining demonstrated the excellent performance of IntNetLncSim. Finally, a web-accessible system was provided for querying LFS and potential lncRNA-disease relationships: http://www.bio-bigdata.com/IntNetLncSim.

Metrology Techniques for the Assembly of NCSX

International Nuclear Information System (INIS)

Priniski, C.; Dodson, T.; Duco, M.; Raftopoulos, S.; Ellis, R.; Brooks, A.

2009-01-01

In support of the National Compact Stellerator Experiment (NCSX), stellerator assembly activities continued this past year at the Princeton Plasma Physics Laboratory (PPPL) in partnership with the Oak Ridge National Laboratory (ORNL). The construction program saw the completion of the first two Half Field-Period Assemblies (HPA), each consisting of three modular coils. The full machine includes six such sub-assemblies. A single HPA consists of three of the NCSX modular coils wound and assembled at PPPL. These geometrically-complex three dimensional coils were wound using computer-aided metrology and CAD models to tolerances within +/- 0.5mm. The assembly of these coils required similar accuracy on a larger scale with the added complexity of more individual parts and fewer degrees of freedom for correction. Several new potential positioning issues developed for which measurement and control techniques were developed. To accomplish this, CAD coordinate-based computer metrology equipment and software similar to the solutions employed for winding the modular coils was used. Given the size of the assemblies, the primary tools were both interferometer aided and Absolute Distance Measurement (ADM)-only based laser trackers. In addition, portable Coordinate Measurement Machine (CMM) arms and some novel indirect measurement techniques were employed. This paper will detail both the use of CAD coordinate-based metrology technology and the techniques developed and employed for dimensional control of NSCX subassemblies. The results achieved and possible improvements to techniques will be discussed.

Metrological inspection of ionization chamber radioactivity meters used in nuclear medicine

International Nuclear Information System (INIS)

Szoerenyi, A.; Vagvoelgyi, J.

1983-01-01

According to the Hungarian legislation on legal metrology, any measurement involving legal effects (e.g. measurements in nuclear medicine) can only be performed by calibrated measuring instruments. The paper outlines the method and results of calibration for 125 I and 131 I radionuclide standard references used in Hungarian nuclear medical practice. The experiences proved that the radionuclide standards, similarly to radiation dosemeters, should be submitted for metrological inspection. (author)

SmartSIM - a virtual reality simulator for laparoscopy training using a generic physics engine.

Science.gov (United States)

Khan, Zohaib Amjad; Kamal, Nabeel; Hameed, Asad; Mahmood, Amama; Zainab, Rida; Sadia, Bushra; Mansoor, Shamyl Bin; Hasan, Osman

2017-09-01

Virtual reality (VR) training simulators have started playing a vital role in enhancing surgical skills, such as hand-eye coordination in laparoscopy, and practicing surgical scenarios that cannot be easily created using physical models. We describe a new VR simulator for basic training in laparoscopy, i.e. SmartSIM, which has been developed using a generic open-source physics engine called the simulation open framework architecture (SOFA). This paper describes the systems perspective of SmartSIM including design details of both hardware and software components, while highlighting the critical design decisions. Some of the distinguishing features of SmartSIM include: (i) an easy-to-fabricate custom-built hardware interface; (ii) use of a generic physics engine to facilitate wider accessibility of our work and flexibility in terms of using various graphical modelling algorithms and their implementations; and (iii) an intelligent and smart evaluation mechanism that facilitates unsupervised and independent learning. Copyright © 2016 John Wiley & Sons, Ltd.

Sims, Christopher Albert (born 1942)

NARCIS (Netherlands)

Boumans, Marcel

2015-01-01

Christopher Sims is one of the leaders in time-series econometrics and empirical macroeconomics and is well known for introducing the VAR approach to econometrics and macroeconomic modelling. Sims’ main contribution to empirical macroeconomics was to show how macro-econometric modeling should be

Sim@P1: Using Cloudscheduler for offline processing on the ATLAS HLT farm

CERN Document Server

Berghaus, Frank; The ATLAS collaboration

2018-01-01

The Simulation at Point1 (Sim@P1) project was built in 2013 to take advantage of the ATLAS Trigger and Data Acquisition High Level Trigger (HLT) farm. The HLT farm provides more than 2,000 compute nodes, which are critical to ATLAS during data taking. When ATLAS is not recording data, this large compute resource is used to generate and process simulation data for the experiment. The Sim@P1 system uses virtual machines, deployed by OpenStack, in order to isolate the resources from the ATLAS technical and control network. During the upcoming long shutdown in 2019 (LS2), the HLT farm including the Sim@P1 infrastructure will be upgraded. A previous paper on the project emphasized the need for “simple, reliable, and efficient tools” to quickly switch between data acquisition operation and offline processing.In this contribution we assess various options for updating and simplifying the provisional tools. Cloudscheduler is a tool for provisioning cloud resources for batch computing that has been managing cloud ...

Material synthesis and evaluation of metrological characteristics of potassium fluozirconate certified reference material

Directory of Open Access Journals (Sweden)

D. G. Lisienko

2016-01-01

Full Text Available The relevance of the study. For metrological support of control methods for composition ofpotassium fluozirconate, used in the production of metallic zirconium, applied in various technical fields, including nuclear power, electronics, chemical engineering. The purpose: development of synthesis technology, and determination of metrological characteristics of certified reference material for composition ofpotassium fluozirconate (set, intended for metrological support of measuring element mass fraction: hafnium (Hf, silicon (Si, iron (Fe, aluminium (Al, chromium (Cr, tin (Sn, titanium (Ti in potassium fluozirconate. Research methods: X-ray diffraction, differential scanning colorimetry, thermogravimetric analysis, atomic-emission spectral analysis with arc excitation, mass spectral analysis, X-ray fluorescence analysis. Results. As a result of research a set of certified reference materials for composition of potassium fluozirconate is developed and produced. The CRM type is approved by Federal Agency on Technical Regulating and Metrology and registered in State Register of Approved Reference Material Types under number GSO 10593-2015.

Metrology Sampling Strategies for Process Monitoring Applications

KAUST Repository

Vincent, Tyrone L.; Stirton, James Broc; Poolla, Kameshwar

2011-01-01

, economic pressures prompt a reduction in metrology, for both capital and cycle-time reasons. This paper explores the use of modeling and minimum-variance prediction as a method to select the sites for measurement on each wafer. The models are developed

Dynamic Length Metrology (DLM) for measurements with sub-micrometre uncertainty in a production environment

DEFF Research Database (Denmark)

De Chiffre, Leonardo; Hansen, Hans Nørgaard; Hattel, Jesper Henri

2016-01-01

Conventional length metrology for traceable accurate measurements requires costly temperature controlled facilities, long waiting time for part acclimatisation, and separate part material characterisation. This work describes a method called Dynamic Length Metrology (DLM) developed to achieve sub...

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad

Energy Technology Data Exchange (ETDEWEB)

Alcock, Simon G., E-mail: simon.alcock@diamond.ac.uk; Nistea, Ioana; Sawhney, Kawal [Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

2016-05-15

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM’s autocollimator adds into the overall measured value of the mirror’s slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad

International Nuclear Information System (INIS)

Alcock, Simon G.; Nistea, Ioana; Sawhney, Kawal

2016-01-01

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM’s autocollimator adds into the overall measured value of the mirror’s slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad.

Science.gov (United States)

Alcock, Simon G; Nistea, Ioana; Sawhney, Kawal

2016-05-01

We present a comprehensive investigation of the systematic and random errors of the nano-metrology instruments used to characterize synchrotron X-ray optics at Diamond Light Source. With experimental skill and careful analysis, we show that these instruments used in combination are capable of measuring state-of-the-art X-ray mirrors. Examples are provided of how Diamond metrology data have helped to achieve slope errors of <100 nrad for optical systems installed on synchrotron beamlines, including: iterative correction of substrates using ion beam figuring and optimal clamping of monochromator grating blanks in their holders. Simulations demonstrate how random noise from the Diamond-NOM's autocollimator adds into the overall measured value of the mirror's slope error, and thus predict how many averaged scans are required to accurately characterize different grades of mirror.

SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?

Energy Technology Data Exchange (ETDEWEB)

Gorondy-Novak, S. [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France); Jomard, F. [Groupe d' Etude de la Matière Condensée, CNRS, UVSQ, 45 avenue des Etats-Unis, 78035 Versailles cedex (France); Prima, F. [PSL Research University, Chimie ParisTech – CNRS, Institut de Recherche de Chimie Paris, 75005 Paris (France); Lefaix-Jeuland, H., E-mail: helene.lefaix@cea.fr [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France)

2017-05-01

Reliable He profiles are highly desirable for better understanding helium behavior in materials for future nuclear applications. Recently, Secondary Ions Mass Spectrometry (SIMS) allowed the characterization of helium distribution in as-implanted metallic systems. The Cs{sup +} primary ion beam coupled with CsHe{sup +} molecular detector appeared to be a promising technique which overcomes the very high He ionization potential. In this study, {sup 4}He depth profiles in pure body centered cubic (bcc) metals (V, Fe, Ta, Nb and Mo) as-implanted and annealed, were obtained by SIMS. All as-implanted samples exhibited a projected range of around 200 nm, in agreement with SRIM theoretical calculations. After annealing treatment, SIMS measurements evidenced the evolution of helium depth profile with temperature. The latter SIMS results were compared to the helium bubble distribution obtained by Transmission Electron Microscopy (TEM). This study confirmed the great potential of this experimental procedure as a He-depth profiling technique in bcc metals. Indeed, the methodology described in this work could be extended to other materials including metallic and non-metallic compounds. Nevertheless, the quantification of helium concentration after annealing treatment by SIMS remains uncertain probably due to the non-uniform ionization efficiency in samples containing large bubbles.

The Pedagogical Benefits of "SimCity" in Urban Geography Education

Science.gov (United States)

Kim, Minsung; Shin, Jungyeop

2016-01-01

This article investigated the pedagogical potential of the "SimCity" simulation game in an urban geography course. University students used "SimCity" to build their own cities and applied a wide range of theories to support their urban structures. Moreover, the students critically evaluated the logic and functioning of the…

Teaching the Teacher: Tutoring SimStudent Leads to More Effective Cognitive Tutor Authoring

Science.gov (United States)

Matsuda, Noboru; Cohen, William W.; Koedinger, Kenneth R.

2015-01-01

SimStudent is a machine-learning agent initially developed to help novice authors to create cognitive tutors without heavy programming. Integrated into an existing suite of software tools called Cognitive Tutor Authoring Tools (CTAT), SimStudent helps authors to create an expert model for a cognitive tutor by tutoring SimStudent on how to solve…

Metrology for the radiological early warning system in Europe. The ''MetroERM'' project; Metrologie fuer die radiologischen Fruehwarnsysteme in Europa. Das ''MetroERM''-Projekt

Energy Technology Data Exchange (ETDEWEB)

Neumaier, Stefan; Dombrowski, Harald [Physikalisch-Technische Bundesanstalt, Braunschweig (Germany)

2017-10-01

In the European radiological early warning system about 5500 stationary sensors are actually implemented that measure continuously the local dose rate. Alongside several hundred air dust collecting systems attribute to the measurement of airborne radioactivity. The local dose rates are transmitted hourly to a central data base that is operated on behalf of the EU commission. In significantly larger time intervals the measured data of the airborne radioactivity are transmitted. In case of a cross-border radiological accident these data are the basis for recommendations given by the EU commission to the member states for national counter measures. The focus of the project ''Metrology for radiological early warning networks in Europe'' is an improvement of the metrological quality and harmonization these data and the development of improved measuring systems and evaluation methods.

Laser metrology applied to the nuclear maintenance

International Nuclear Information System (INIS)

Garrido Garcia, J.; Sarti Fernandez, F.

2012-01-01

The development of this paper focuses on providing an overview of the state of the art about laser metrology. This type of equipment combines the measurement philosophy of laser scanning with the great precision of the robotic equipment of auscultation. Getting micron.

Gloss evaluation from soft and hard metrologies.

Science.gov (United States)

Wang, Zihao; Xu, Lihao; Hu, Yu; Mirjalili, Fereshteh; Luo, Ming Ronnier

2017-09-01

Recent advances in bidirectional reflectance distribution function (BRDF) acquisitions have provided a novel approach for appearance measurement and analysis. In particular, since gloss appearance is dependent on the directional reflective properties of surfaces, it is reasonable to leverage the BRDF for gloss evaluation. In this paper, we investigate gloss appearance from both soft metrology and hard metrology. A psychophysical experiment was conducted for the gloss assessment of 47 neutral-color samples. In the evaluation of gloss perception from gloss meter measurements, we report several ambiguous correspondences in the medium gloss range. In order to analyze and explain this phenomenon, the BRDF was acquired and examined using a commercial BRDF measuring device. With an improved correlation-to-visual perception, we propose a two-dimensional gloss model by combining a parameter, the standard deviation of the specular lobe, from Ward's BRDF model with measured gloss values.

PetroSim - a system to simulate crowd behaviors in emergency situations

Energy Technology Data Exchange (ETDEWEB)

Musse, Soraia R.; Silva, Andre T. da; Hardt, Katia; Barros, Leandro M.; Tonietto, Leandro [Universidade do Vale do Rio dos Sinos (UNISINOS), Sao Leopoldo, RS (Brazil). Dept. de Ciencia da Computacao; Roth, Bruno [Instituto Nacional de Pesquisas Espaciais (INPE), Sao Jose dos Campos, SP (Brazil); Rolim, Tuerte Amaral; Melo, Ricardo U.M.; Felipe, Luiz A.B. [PETROBRAS, Natal/Fortaleza, RN/CE (Brazil). Unidade de Negocios RN/CE

2004-07-01

This paper presents a framework to simulate the behaviors of crowds in panic situations. The main motivation for this work is to provide to safety engineers the possibility of simulating several aspects of panic situations involving crowds in real time. To accomplish this, we propose a complete framework to model the semantically informed environment as well as the intelligent virtual agents (IVA), which form the crowd who lives in the simulated virtual city. This work includes the integration of many knowledge areas such as VR, behavioral and visualization aspects required to the development of PetroSim. (author)

A comparative Study between GoldSim and AMBER Based Biosphere Assessment Models for an HLW Repository

International Nuclear Information System (INIS)

Lee, Youn-Myoung; Hwang, Yong-Soo

2007-01-01

To demonstrate the performance of a repository, the dose exposure rate to human being due to long-term nuclide releases from a high-level waste repository (HLW) should be evaluated and the results compared to the dose limit presented by the regulatory bodies. To evaluate such a dose rate to an individual, biosphere assessment models have been developed and implemented for a practical calculation with the aid of such commercial tools as AMBER and GoldSim, both of which are capable of probabilistic and deterministic calculation. AMBER is a general purpose compartment modeling tool and GoldSim is another multipurpose simulation tool for dynamically modeling complex systems, supporting a higher graphical user interface than AMBER and a postprocessing feature. And also unlike AMBER, any kind of compartment scheme can be rather simply constructed with an appropriate transition rate between compartments, GoldSim is designed to facilitate the object-oriented modules to address any specialized programs, similar to solving jig saw puzzles. During the last couple of years a compartment modeling approach for a biosphere has been mainly carried out with AMBER in KAERI in order to conservatively or rather roughly provide dose conversion factors to get the final exposure rate due to a nuclide flux into biosphere over various geosphere-biosphere interfaces (GBIs) calculated through nuclide transport modules. This caused a necessity for a newly devised biosphere model that could be coupled to a nuclide transport model with less conservatism in the frame of the development of a total system performance assessment modeling tool, which could be successfully done with the aid of GoldSim. Therefore, through the current study, some comparison results of the AMBER and the GoldSim approaches for the same case of a biosphere modeling without any consideration of geosphere transport are introduced by extending a previous study

Metabolic activity of uncultivated magnetotactic bacteria revealed by NanoSIMS

Science.gov (United States)

He, M.; Zhang, W.; Gu, L.; Pan, Y.; Lin, W.

2017-12-01

Microorganisms that exhibit magnetotaxis behavior, collectively known as the magnetotactic bacteria (MTB), are those whose motility is influenced by the Earth's magnetic field. MTB are a physiologically diverse group of bacteria with a unique feature of intracellular biomineralization of magnetosomes (Fe3O4 and/or Fe3S4) (Bazylinski et al., 2013). However, the ecophysiology of uncultivated MTB, especially those within the Nitrospirae phylum forming hundreds of bullet-shaped magnetite magnetosomes per cell, is still not well characterized (Lin et al., 2014). Nanoscale secondary ion mass spectrometry (NanoSIMS) is a powerful tool for revealing element distribution in nanometer-scale resolution, which opens exciting possibilities for the study of interactions between microorganisms and environments (Gao et al., 2016; Musat et al., 2016). Here we applied NanoSIMS to investigate the dynamics of carbon and nitrogen assimilations in two magnetotactic Nitrospirae populations at single cell level. Our NanoSIMS results confirmed the metabolic potential of Nitrospirae MTB proposed by genomic and metagenomic analysis and provided additional insights into the ecophysiology of uncultivated MTB. This study suggests that NanoSIMS-based analyses are powerful approaches for investigating and characterizing the ecological function of environmental microorganisms. References: Bazylinski D A., Lefèvre, C T., Schüler D., 2013. Magnetotactic Bacteria. 453-494.Lin W, Bazylinski DA, Xiao T, Wu L- F, Pan Y., 2014. Life with compass: diversity and biogeography of magnetotactic bacteria. Environ Microbiol, 16: 1462-2920.Gao D., Huang X., Tao Y., 2016. A critical review of NanoSIMS in analysis of microbial metabolic activities at single-cell level. Crit Rev Biotechnol, 36: 884-890.Musat N., Musat F., Weber PK., Pett-Ridge J., 2016. Tracking microbial interactions with NanoSIMS. Curr Opin Biotechnol, 41: 114-121.

xLPR Sim Editor 1.0 User's Guide

Energy Technology Data Exchange (ETDEWEB)

Mariner, Paul

2017-03-01

The United States Nuclear Regulatory Commission in cooperation with the Electric Power Research Institute contracted Sandia National Laboratories to develop the framework of a probabilistic fracture mechanics assessment code called xLPR ( Extremely Low Probability of Rupture) Version 2.0 . The purpose of xLPR is to evaluate degradation mechanisms in piping systems at nuclear power plants and to predict the probability of rupture. This report is a user's guide for xLPR Sim Editor 1.0 , a graphical user interface for creating and editing the xLPR Version 2.0 input file and for creating, editing, and using the xLPR Version 2.0 database files . The xLPR Sim Editor, provides a user - friendly way for users to change simulation options and input values, s elect input datasets from xLPR data bases, identify inputs needed for a simulation, and create and modify an input file for xLPR.

ChromBiSim: Interactive chromatin biclustering using a simple approach.

Science.gov (United States)

Noureen, Nighat; Zohaib, Hafiz Muhammad; Qadir, Muhammad Abdul; Fazal, Sahar

2017-10-01

Combinatorial patterns of histone modifications sketch the epigenomic locale. Specific positions of these modifications in the genome are marked by the presence of such signals. Various methods highlight such patterns on global scale hence missing the local patterns which are the actual hidden combinatorics. We present ChromBiSim, an interactive tool for mining subsets of modifications from epigenomic profiles. ChromBiSim efficiently extracts biclusters with their genomic locations. It is the very first user interface based and multiple cell type handling tool for decoding the interplay of subsets of histone modifications combinations along their genomic locations. It displays the results in the forms of charts and heat maps in accordance with saving them in files which could be used for post analysis. ChromBiSim tested on multiple cell types produced in total 803 combinatorial patterns. It could be used to highlight variations among diseased versus normal cell types of any species. ChromBiSim is available at (http://sourceforge.net/projects/chrombisim) in C-sharp and python languages. Copyright © 2017 Elsevier Inc. All rights reserved.

The Opportunities and Challenges of Bringing New Metrology Equipment to Market

Science.gov (United States)

Perloff, David S.

2005-09-01

This paper provides an overview of the economic and technological factors which are driving the demand for new metrology and inspection equipment, the challenges and opportunities facing new companies in bringing such equipment to market, and the funding environment in which new companies must raise capital to finance their efforts. Seven metrology companies and one inspection equipment company that have received first-time venture backing since 2000 are used to illustrate how these specialized businesses are launched and funded.

100 Years of radionuclide metrology

International Nuclear Information System (INIS)

Judge, S.M.; Arnold, D.; Chauvenet, B.; Collé, R.; De Felice, P.; García-Toraño, E.; Wätjen, U.

2014-01-01

The discipline of radionuclide metrology at national standards institutes started in 1913 with the certification by Curie, Rutherford and Meyer of the first primary standards of radium. In early years, radium was a valuable commodity and the aim of the standards was largely to facilitate trade. The focus later changed to providing standards for the new wide range of radionuclides, so that radioactivity could be used for healthcare and industrial applications while minimising the risk to patients, workers and the environment. National measurement institutes responded to the changing demands by developing new techniques for realising primary standards of radioactivity. Looking ahead, there are likely to be demands for standards for new radionuclides used in nuclear medicine, an expansion of the scope of the field into quantitative imaging to facilitate accurate patient dosimetry for nuclear medicine, and an increasing need for accurate standards for radioactive waste management and nuclear forensics. - Highlights: • The driving forces for the development of radionuclide metrology. • Radium standards to facilitate trade of this valuable commodity in the early years. • After 1950, focus changes to healthcare and industrial applications. • National Measurement Institutes develop new techniques, standards, and disseminate the best practice in measurement. • Challenges in nuclear medicine, radioactive waste management and nuclear forensics

A GoldSim modeling approach to safety assessment of an LILW repository system

International Nuclear Information System (INIS)

Lee, Youn Myoung; Jeong, Jongtae; Choi, Jongwon

2011-01-01

A program for the safety assessment and performance evaluation of a low- and intermediate level waste (LILW) repository system has been developed by utilizing GoldSim. By utilizing this nuclide transport in the near- and far-field of a repository as well as a transport through a biosphere under various natural and manmade disruptive events affecting a nuclide release are modeled and evaluated. To demonstrate its usability, some illustrative cases under the selected scenarios including the influence of degradation of manmade barriers, pumping well drilling, and the natural disruptive events such as a sudden formation of preferential flow pathway have been investigated and illustrated for a hypothetical LILW repository. Even though all the parameter values applied to a hypothetical repository are assumed without any real base, the illustrative cases could be informative especially when seeing the result of the probabilistic calculation or sensitivity studies with various scenarios that possibly happen for nuclide release and further transport. (author)

Profile variation impact on FIB cross-section metrology

Science.gov (United States)

Cordes, Aaron; Bunday, Benjamin; Nadeau, Jim

2012-03-01

The focused ion beam (FIB) milling tool is an important component of reference metrology and process characterization, both as a supporting instrument for bulk sample preparation before forwarding to the transmission electron microscope (TEM) and other instruments and as an in situ measurement instrument using angled scanning electron microscopy. As features grow denser, deeper and more demanding, full-profile reference metrology is needed, and this methodology will only grow in importance. Thus, the ability to extract accurate dimensional and profile information out of the crosssectional faces produced by FIB milling is critical. For features that demonstrate perfect symmetry in the plane of the cross section, analyzing images and extracting metrology data are straightforward. However, for industrial materials, symmetry is not a safe assumption: as features shrink, the line edge and sidewall roughness increases as a percentage of the overall feature dimension. Furthermore, with the introduction of more complex architectures such as 3D memory and FinFETs, the areas of greatest interest, such as the intersections of wrap-around gates, cannot be assumed to be symmetrical in any given plane if cut placement is not precisely controlled. Therefore it is important to establish the exact location and repeatability of the cross-section plane, both in terms of coordinate placement and effective angle of the milled surface. To this end, we prepared designed-in line edge roughness samples in the Albany Nanotech facility using SEMATECH's AMAG6 metrology reticle. The samples were thoroughly characterized before being milled by a non-destructive, sidewall-scanning atomic force microscope (AFM). These samples are then milled and measured under varying process and setup parameters using a single-beam FIB with angled SEM. We established methodologies that allow precise alignment of the cut planes of slice-and-view FIB milling to 3D-AFM scan lines to compare repeated sections

Sims for Science: Powerful Tools to Support Inquiry-Based Teaching

Science.gov (United States)

Perkins, Katherine K.; Loeblein, Patricia J.; Dessau, Kathryn L.

2010-01-01

Since 2002, the PhET Interactive Simulations project at the University of Colorado has been working to provide learning tools for students and teachers. The project has developed over 85 interactive simulations--or sims--for teaching and learning science. Although these sims can be used in a variety of ways, they are specifically designed to make…

Surface studies on uranium monocarbide using XPS and SIMS

International Nuclear Information System (INIS)

Asuvathraman, R.

1995-01-01

The air-exposed surfaces of sintered and arc-melted UC samples were examined by XPS and SIMS. XPS results indicate that the surface is covered with a very thin layer of UO 2 mixed with free carbon, which would have formed along with the oxide during the reaction between UC and oxygen or moisture. From the SIMS depth profile of oxygen, the thickness of the oxide layer is found to be approximately 10 nm. The SIMS oxygen images of the surface as a function of etching time reveal that the surface of UC consists of a top layer of adsorbed moisture/oxygen; this contamination layer is followed by a layer containing uranium oxide, uranium hydroxide and free carbon and then grain boundary oxide and finally bulk UC. The behaviour of sintered and arc-melted samples is similar. ((orig.))

Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon

International Nuclear Information System (INIS)

Gillen, Greg; Batteas, James; Michaels, Chris A.; Chi, Peter; Small, John; Windsor, Eric; Fahey, Albert; Verkouteren, Jennifer; Kim, K.J.

2006-01-01

A C 60 + primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an emphasis on possible application of C 60 + depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials. Unexpectedly, C 60 + SIMS depth profiling of silicon was found to be complicated by the deposition of an amorphous carbon layer which buries the silicon substrate. Sputtering of the silicon was observed only at the highest accessible beam energies (14.5 keV impact) or by using oxygen backfilling. C 60 + SIMS depth profiling of As delta-doped test samples at 14.5 keV demonstrated a substantial (factor of 5) degradation in depth resolution compared to Cs + SIMS depth profiling. This degradation is thought to result from the formation of an unusual platelet-like grain structure on the SIMS crater bottoms. Other unusual topographical features were also observed on silicon substrates after high primary ion dose C 60 + bombardment

Graphene Oxide as a Novel Evenly Continuous Phase Matrix for TOF-SIMS.

Science.gov (United States)

Cai, Lesi; Sheng, Linfeng; Xia, Mengchan; Li, Zhanping; Zhang, Sichun; Zhang, Xinrong; Chen, Hongyuan

2017-03-01

Using matrix to enhance the molecular ion signals for biomolecule identification without loss of spatial resolution caused by matrix crystallization is a great challenge for the application of TOF-SIMS in real-world biological research. In this report, graphene oxide (GO) was used as a matrix for TOF-SIMS to improve the secondary ion yields of intact molecular ions ([M + H] + ). Identifying and distinguishing the molecular ions of lipids (m/z >700) therefore became straightforward. The spatial resolution of TOF-SIMS imaging could also be improved as GO can form a homogeneous layer of matrix instead of crystalline domain, which prevents high spatial resolution in TOF-SIMS imaging. Lipid mapping in presence of GO revealed the delicate morphology and distribution of single vesicles with a diameter of 800 nm. On GO matrix, the vesicles with similar shape but different chemical composition could be distinguished using molecular ions. This novel matrix holds potentials in such applications as the analysis and imaging of complex biological samples by TOF-SIMS. Graphical Abstract ᅟ.

CONFERENCE NOTE: European Optical Society, Topical Meeting Optical Metrology and Nanotechnology, Engelberg, Switzerland, 27 30 March 1994

Science.gov (United States)

1993-01-01

This meeting, organized by the Paul Scherrer Institute's Department of Applied Solid State Physics, will be held from 27 30 March 1994 at the Hotel Regina-Titlis, Engelberg, Switzerland. The aim is to bring together scientists from two important fields of current research and increasing industrial relevance. Optical metrology is a traditional discipline of applied optics which reached the nanometre scale a long time ago. Nanotechnology is setting new limits and represents a major challenge to metrology, as well as offering new opportunities to optics. The meeting is intended to help define a common future for optical metrology and nanotechnology. Topics to be covered include: nanometre position control and measuring techniques ultrahigh precision interferometry scanning probe microscopy (AFM, SNOM, etc.) surface modification by scanning probe methods precision surface fabrication and characterization nanolithography micro-optics, diffractive optics components, including systems and applications subwavelength optical structures synthetic optical materials structures and technologies for X-ray optics. For further information please contact: Jens Gobrecht (Secretary), Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.Tel. (41)56992529; Fax (41) 5698 2635.

Benchmarking Exercises To Validate The Updated ELLWF GoldSim Slit Trench Model

International Nuclear Information System (INIS)

Taylor, G. A.; Hiergesell, R. A.

2013-01-01

The Savannah River National Laboratory (SRNL) results of the 2008 Performance Assessment (PA) (WSRC, 2008) sensitivity/uncertainty analyses conducted for the trenches located in the EArea LowLevel Waste Facility (ELLWF) were subject to review by the United States Department of Energy (U.S. DOE) Low-Level Waste Disposal Facility Federal Review Group (LFRG) (LFRG, 2008). LFRG comments were generally approving of the use of probabilistic modeling in GoldSim to support the quantitative sensitivity analysis. A recommendation was made, however, that the probabilistic models be revised and updated to bolster their defensibility. SRS committed to addressing those comments and, in response, contracted with Neptune and Company to rewrite the three GoldSim models. The initial portion of this work, development of Slit Trench (ST), Engineered Trench (ET) and Components-in-Grout (CIG) trench GoldSim models, has been completed. The work described in this report utilizes these revised models to test and evaluate the results against the 2008 PORFLOW model results. This was accomplished by first performing a rigorous code-to-code comparison of the PORFLOW and GoldSim codes and then performing a deterministic comparison of the two-dimensional (2D) unsaturated zone and three-dimensional (3D) saturated zone PORFLOW Slit Trench models against results from the one-dimensional (1D) GoldSim Slit Trench model. The results of the code-to-code comparison indicate that when the mechanisms of radioactive decay, partitioning of contaminants between solid and fluid, implementation of specific boundary conditions and the imposition of solubility controls were all tested using identical flow fields, that GoldSim and PORFLOW produce nearly identical results. It is also noted that GoldSim has an advantage over PORFLOW in that it simulates all radionuclides simultaneously - thus avoiding a potential problem as demonstrated in the Case Study (see Section 2.6). Hence, it was concluded that the follow

Benchmarking Exercises To Validate The Updated ELLWF GoldSim Slit Trench Model

Energy Technology Data Exchange (ETDEWEB)

Taylor, G. A.; Hiergesell, R. A.

2013-11-12

The Savannah River National Laboratory (SRNL) results of the 2008 Performance Assessment (PA) (WSRC, 2008) sensitivity/uncertainty analyses conducted for the trenches located in the EArea LowLevel Waste Facility (ELLWF) were subject to review by the United States Department of Energy (U.S. DOE) Low-Level Waste Disposal Facility Federal Review Group (LFRG) (LFRG, 2008). LFRG comments were generally approving of the use of probabilistic modeling in GoldSim to support the quantitative sensitivity analysis. A recommendation was made, however, that the probabilistic models be revised and updated to bolster their defensibility. SRS committed to addressing those comments and, in response, contracted with Neptune and Company to rewrite the three GoldSim models. The initial portion of this work, development of Slit Trench (ST), Engineered Trench (ET) and Components-in-Grout (CIG) trench GoldSim models, has been completed. The work described in this report utilizes these revised models to test and evaluate the results against the 2008 PORFLOW model results. This was accomplished by first performing a rigorous code-to-code comparison of the PORFLOW and GoldSim codes and then performing a deterministic comparison of the two-dimensional (2D) unsaturated zone and three-dimensional (3D) saturated zone PORFLOW Slit Trench models against results from the one-dimensional (1D) GoldSim Slit Trench model. The results of the code-to-code comparison indicate that when the mechanisms of radioactive decay, partitioning of contaminants between solid and fluid, implementation of specific boundary conditions and the imposition of solubility controls were all tested using identical flow fields, that GoldSim and PORFLOW produce nearly identical results. It is also noted that GoldSim has an advantage over PORFLOW in that it simulates all radionuclides simultaneously - thus avoiding a potential problem as demonstrated in the Case Study (see Section 2.6). Hence, it was concluded that the follow

The Structured Inventory of Malingered Symptomatology (SIMS): a systematic review and meta-analysis.

Science.gov (United States)

van Impelen, Alfons; Merckelbach, Harald; Jelicic, Marko; Merten, Thomas

2014-01-01

We meta-analytically reviewed studies that used the Structured Inventory of Malingered Symptomatology (SIMS) to detect feigned psychopathology. We present weighted mean diagnostic accuracy and predictive power indices in various populations, based on 31 studies, including 61 subsamples and 4009 SIMS protocols. In addition, we provide normative data of patients, claimants, defendants, nonclinical adults, and various experimental feigners, based on 41 studies, including 125 subsamples and 4810 SIMS protocols. We conclude that the SIMS (1) is able to differentiate well between instructed feigners and honest responders; (2) generates heightened scores in groups that are known to have a raised prevalence of feigning (e.g., offenders who claim crime-related amnesia); (3) may overestimate feigning in patients who suffer from schizophrenia, intellectual disability, or psychogenic non-epileptic seizures; and (4) is fairly robust against coaching. The diagnostic power of the traditional cut scores of the SIMS (i.e., > 14 and > 16) is not so much limited by their sensitivity—which is satisfactory—but rather by their substandard specificity. This, however, can be worked around by combining the SIMS with other symptom validity measures and by raising the cut score, although the latter solution sacrifices sensitivity for specificity.

Student Perceptions of SocialSim for Simulation-Based Interprofessional Education in Healthcare

Science.gov (United States)

Smith, Mary Kathryn

2016-01-01

This descriptive qualitative study investigates perceptions of students regarding the use of SocialSim, a tool designed to deliver simulation in a virtual environment using social media as a platform to facilitate inteprofessional education. There have been exponential changes in U.S. healthcare system in recent years, prompting the need for…

SimCP3—An Advanced Homologue of SimCP2 as a Solution-Processed Small Molecular Host Material for Blue Phosphorescence Organic Light-Emitting Diodes

Directory of Open Access Journals (Sweden)

Yi-Ting Lee

2016-09-01

Full Text Available We have overcome the synthetic difficulty of 9,9′,9′′,9′′′,9′′′′,9′′′′′-((phenylsilanetriyltris(benzene-5,3,1-triylhexakis(9H-carbazole (SimCP3 an advanced homologue of previously known SimCP2 as a solution-processed, high triplet gap energy host material for a blue phosphorescence dopant. A series of organic light-emitting diodes based on blue phosphorescence dopant iridium (III bis(4,6-difluorophenylpyridinatopicolate, FIrpic, were fabricated and tested to demonstrate the validity of solution-processed SimCP3 in the device fabrication.

A GoldSim Based Biosphere Assessment Model for a HLW Repository

International Nuclear Information System (INIS)

Lee, Youn-Myoung; Hwang, Yong-Soo; Kang, Chul-Hyung

2007-01-01

To demonstrate the performance of a repository, the dose exposure to a human being due to nuclide releases from a repository should be evaluated and the results compared to the dose limit presented by the regulatory bodies. To evaluate a dose rate to an individual due to a long-term release of nuclides from a HLW repository, biosphere assessment models and their implemented codes such as ACBIO1 and ACBIO2 have been developed with the aid of AMBER during the last few years. BIOMASS methodology has been adopted for a HLW repository currently being considered in Korea, which has a similar concept to the Swedish KBS-3 HLW repository. Recently, not just only for verifying the purpose for biosphere assessment models but also for varying the possible alternatives to assess the consequences in a biosphere due to a HLW repository, another version of the assessment modesl has been newly developed in the frame of development programs for a total system performance assessment modeling tool by utilizing GoldSim. Through a current study, GoldSim approach for a biosphere modeling is introduced. Unlike AMBER by which a compartment scheme can be rather simply constructed with an appropriate transition rate between compartments, GoldSim was designed to facilitate the object-oriented modules by which specific models can be addressed in an additional manner, like solving jig saw puzzles

Enhacement of intrafield overlay using a design based metrology system

Science.gov (United States)

Jo, Gyoyeon; Ji, Sunkeun; Kim, Shinyoung; Kang, Hyunwoo; Park, Minwoo; Kim, Sangwoo; Kim, Jungchan; Park, Chanha; Yang, Hyunjo; Maruyama, Kotaro; Park, Byungjun

2016-03-01

As the scales of the semiconductor devices continue to shrink, accurate measurement and control of the overlay have been emphasized for securing more overlay margin. Conventional overlay analysis methods are based on the optical measurement of the overlay mark. However, the overlay data obtained from these optical methods cannot represent the exact misregistration between two layers at the circuit level. The overlay mismatch may arise from the size or pitch difference between the overlay mark and the real pattern. Pattern distortion, caused by CMP or etching, could be a source of the overlay mismatch as well. Another issue is the overlay variation in the real circuit pattern which varies depending on its location. The optical overlay measurement methods, such as IBO and DBO that use overlay mark on the scribeline, are not capable of defining the exact overlay values of the real circuit. Therefore, the overlay values of the real circuit need to be extracted to integrate the semiconductor device properly. The circuit level overlay measurement using CDSEM is time-consuming in extracting enough data to indicate overall trend of the chip. However DBM tool is able to derive sufficient data to display overlay tendency of the real circuit region with high repeatability. An E-beam based DBM(Design Based Metrology) tool can be an alternative overlay measurement method. In this paper, we are going to certify that the overlay values extracted from optical measurement cannot represent the circuit level overlay values. We will also demonstrate the possibility to correct misregistration between two layers using the overlay data obtained from the DBM system.

Plant equipment services with laser metrology

International Nuclear Information System (INIS)

Hayes, J.H.; Kreitman, P.J.

1995-01-01

A new industrial metrology process is now being applied to support PWR Nuclear Plant Steam Generator Replacement Projects. The method uses laser tracking interferometry to perform as built surveys of existing and replacement plant equipment. This method provides precision data with a minimum of setup when compared to alternative methods available. In addition there is no post processing required to ascertain validity. The data is obtained quickly, processed in real time and displayed during the survey in the desired coordinate system. These capabilities make this method of industrial measure ideal for various data acquisition needs throughout the power industry, from internal/external equipment templating to area mapping. Laser tracking interferometry is an improvement on the present use of optical instruments and surveying technique. In order to describe the laser tracking interferometry measurement process, previous methods of templating and surveying are first reviewed

Chemical Visualization of Sweat Pores in Fingerprints Using GO-Enhanced TOF-SIMS.

Science.gov (United States)

Cai, Lesi; Xia, Meng-Chan; Wang, Zhaoying; Zhao, Ya-Bin; Li, Zhanping; Zhang, Sichun; Zhang, Xinrong

2017-08-15

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used in imaging of small molecules (SIMS was used to detect and image relatively high mass molecules such as poison, alkaloids (>600 Da) and controlled drugs, and antibiotics (>700 Da) in fingerprints. Detail features of fingerprints such as the number and distribution of sweat pores in a ridge and even the delicate morphology of one pore were clearly revealed in SIMS images of relatively high mass molecules. The detail features combining with identified chemical composition were sufficient to establish a human identity and link the suspect to a crime scene. The wide detectable mass range and high spatial resolution make GO-enhanced TOF-SIMS a promising tool in accurate and fast analysis of fingerprints, especially in fragmental fingerprint analysis.

Handbook of 3D machine vision optical metrology and imaging

CERN Document Server

Zhang, Song

2013-01-01

With the ongoing release of 3D movies and the emergence of 3D TVs, 3D imaging technologies have penetrated our daily lives. Yet choosing from the numerous 3D vision methods available can be frustrating for scientists and engineers, especially without a comprehensive resource to consult. Filling this gap, Handbook of 3D Machine Vision: Optical Metrology and Imaging gives an extensive, in-depth look at the most popular 3D imaging techniques. It focuses on noninvasive, noncontact optical methods (optical metrology and imaging). The handbook begins with the well-studied method of stereo vision and

Preparing strategic information management plans for hospitals: a practical guideline SIM plans for hospitals: a guideline.

Science.gov (United States)

Brigl, B; Ammenwerth, E; Dujat, C; Gräber, S; Grosse, A; Häber, A; Jostes, C; Winter, A

2005-01-01

Systematic information management in hospitals demands for a strategic information management plan (SIM plan). As preparing a SIM plan is a considerable challenge we provide a practical guideline that is directly applicable when a SIM plan is going to be prepared. The guideline recommends a detailed structure of a SIM plan and gives advice about its content and the preparation process. It may be used as template, which can be adapted to the individual demands of any hospital. The guideline was used in several hospitals preparing a SIM plan. Experiences showed that the SIM plans could be prepared very efficiently and timely using the guideline, that the proposed SIM plan structure suited well, that the guideline offers enough flexibility to meet the requirements of the individual hospitals and that the specific recommendations of the guideline were very helpful. Nevertheless, we must strive for a more comprehensive theory of strategic information management planning which -- in the sense of enterprise architecture planning -- represents the intrinsic correlations of the different parts of a SIM plan to a greater extent.

Revised mechanism of Boyland-Sims oxidation.

Science.gov (United States)

Marjanović, Budimir; Juranić, Ivan; Cirić-Marjanović, Gordana

2011-04-21

New computational insights into the mechanism of the Boyland-Sims oxidation of arylamines with peroxydisulfate (S(2)O(8)(2-)) in an alkaline aqueous solution are presented. The key role of arylnitrenium cations, in the case of primary and secondary arylamines, and arylamine dications and immonium cations, in the case of tertiary arylamines, in the formation of corresponding o-aminoaryl sulfates, as prevalent soluble products, and oligoarylamines, as prevalent insoluble products, is proposed on the basis of the AM1 and RM1 computational study of the Boyland-Sims oxidation of aniline, ring-substituted (2-methylaniline, 3-methylaniline, 4-methylaniline, 2,6-dimethylaniline, anthranilic acid, 4-aminobenzoic acid, sulfanilic acid, sulfanilamide, 4-phenylaniline, 4-bromoaniline, 3-chloroaniline, and 2-nitroaniline) and N-substituted anilines (N-methylaniline, diphenylamine, and N,N-dimethylaniline). Arylnitrenium cations and sulfate anions (SO(4)(2-)) are generated by rate-determining two-electron oxidation of primary and secondary arylamines with S(2)O(8)(2-), while arylamine dications/immonium cations and SO(4)(2-) are initially formed by two-electron oxidation of tertiary arylamines with S(2)O(8)(2-). The subsequent regioselectivity-determining reaction of arylnitrenium cations/arylamine dications/immonium cations and SO(4)(2-), within the solvent cage, is computationally found to lead to the prevalent formation of o-aminoaryl sulfates. The formation of insoluble precipitates during the Boyland-Sims oxidation of arylamines was also computationally studied.

Energy Integration for 2050 - A Strategic Impact Model (2050 SIM), Version 1.0

Energy Technology Data Exchange (ETDEWEB)

2010-10-01

The United States (U.S.) energy infrastructure is among the most reliable, accessible, and economic in the world. On the other hand, it is also excessively reliant on foreign energy sources, experiences high volatility in energy prices, does not always practice good stewardship of finite indigenous energy resources, and emits significant quantities of greenhouse gas. The U.S. Department of Energy is conducting research and development on advanced nuclear reactor concepts and technologies, including High Temperature Gas Reactor (HTGR) technologies, directed at helping the United States meet its current and future energy challenges. This report discusses the Draft Strategic Impact Model (SIM), an initial version of which was created during the later part of FY-2010. SIM was developed to analyze and depict the benefits of various energy sources in meeting the energy demand and to provide an overall system understanding of the tradeoffs between building and using HTGRs versus other existing technologies for providing energy (heat and electricity) to various energy-use sectors in the United States. This report also provides the assumptions used in the model, the rationale for the methodology, and the references for the source documentation and source data used in developing the SIM.

Energy Integration for 2050 - A Strategic Impact Model (2050 SIM), Version 2.0

Energy Technology Data Exchange (ETDEWEB)

John Collins

2011-09-01

The United States (U.S.) energy infrastructure is among the most reliable, accessible, and economic in the world. On the other hand, it is also excessively reliant on foreign energy sources, experiences high volatility in energy prices, does not always practice good stewardship of finite indigenous energy resources, and emits significant quantities of greenhouse gas. The U.S. Department of Energy is conducting research and development on advanced nuclear reactor concepts and technologies, including High Temperature Gas Reactor (HTGR) technologies, directed at helping the United States meet its current and future energy challenges. This report discusses the Draft Strategic Impact Model (SIM), an initial version of which was created during the later part of FY-2010. SIM was developed to analyze and depict the benefits of various energy sources in meeting the energy demand and to provide an overall system understanding of the tradeoffs between building and using HTGRs versus other existing technologies for providing energy (heat and electricity) to various energy-use sectors in the United States. This report also provides the assumptions used in the model, the rationale for the methodology, and the references for the source documentation and source data used in developing the SIM.

Using SIM for strong end-to-end Application Authentication

OpenAIRE

Lunde, Lars; Wangensteen, Audun

2006-01-01

Today the Internet is mostly used for services that require low or none security. The commercial and governmental applications have started to emerge but met problems since they require strong authentication, which is both difficult and costly to realize. The SIM card used in mobile phones is a tamper resistant device that contains strong authentication mechanisms. It would be very convenient and cost-efficient if Internet services could use authentication methods based on the SIM. This mast...

Assessment of the Metrological Performance of Seismic Tables for a QMS Recognition

International Nuclear Information System (INIS)

Ribeiro, A Silva; Costa, A Campos; Candeias, P; Martins, L Lages; Martins, A C Freitas; Ferreira, A C; Sousa, J Alves e

2016-01-01

Seismic testing and analysis using large infrastructures, such as shaking tables and reaction walls, is performed worldwide requiring the use of complex instrumentation systems. To assure the accuracy of these systems, conformity assessment is needed to verify the compliance with standards and applications, and the Quality Management Systems (QMS) is being increasingly applied to domains where risk analysis is critical as a way to provide a formal recognition. This paper describes an approach to the assessment of the metrological performance of seismic shake tables as part of a QMS recognition, with the analysis of a case study of LNEC Seismic shake table. (paper)

Assessment of the Metrological Performance of Seismic Tables for a QMS Recognition

Science.gov (United States)

Silva Ribeiro, A.; Campos Costa, A.; Candeias, P.; Sousa, J. Alves e.; Lages Martins, L.; Freitas Martins, A. C.; Ferreira, A. C.

2016-11-01

Seismic testing and analysis using large infrastructures, such as shaking tables and reaction walls, is performed worldwide requiring the use of complex instrumentation systems. To assure the accuracy of these systems, conformity assessment is needed to verify the compliance with standards and applications, and the Quality Management Systems (QMS) is being increasingly applied to domains where risk analysis is critical as a way to provide a formal recognition. This paper describes an approach to the assessment of the metrological performance of seismic shake tables as part of a QMS recognition, with the analysis of a case study of LNEC Seismic shake table.

The combined measurement of uranium by alpha spectrometry and secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Harvan, D.

2009-01-01

The aim of thesis was to found the dependence between radiometric method - alpha spectrometry and surface sensitive method - Secondary Ion Mass Spectrometry (SIMS). Uranium or naturally occurring uranium isotopes were studied. Samples (high polished stainless steel discs) with uranium isotopes were prepared by electrodeposition. Samples were measured by alpha spectrometry after electrodeposition and treatment. It gives surface activities. Weights, as well as surface's weights of uranium isotopes were calculated from their activities, After alpha spectrometry samples were analyzed by TOF-SIMS IV instrument in International Laser Centre in Bratislava. By the SIMS analysis intensities of uranium-238 were obtained. The interpretation of SIMS intensities vs. surface activity, or surface's weights of uranium isotopes indicates the possibility to use SIMS in quantitative analysis of surface contamination by uranium isotopes, especially 238 U. (author)

Means to verify the accuracy of CT systems for metrology applications (In the Absence of Established International Standards)

International Nuclear Information System (INIS)

Lettenbauer, H.; Georgi, B.; Weib, D.

2007-01-01

X-ray computed tomography (CT) reconstructs an unknown object from X-ray projections and has long been used for qualitative investigation of internal structures in industrial applications. Recently there has been increased interest in applying X-ray cone beam CT to the task of high-precision dimensional measurements of machined parts, since it is a relatively fast method of measuring both inner and outer geometries of arbitrary complexity. The important information for the user in dimensional metrology is if measured elements of a machined part are within the defined tolerances or not. In order to qualify cone beam CT as an established measurement technology, it must be qualified in the same manner as established measurement technologies such as coordinate measurement machines (CMMs) with tactile or optical sensors. In international standards artefacts are defined that are calibrated by certified institutions. These artefacts are defined by certain geometrical elements. CT measurements are performed on the reconstructed object volume, either directly or using an intermediate surface-extraction step. The results of these measurements have to be compared to the values of the calibrated elements; the level of agreement of the results defines the accuracy of the measurements. By using established methods to define measurement uncertainty a very high level of acceptance in dimensional metrology can be reached for the user. Only if results are comparable to standards of the established technologies the barriers of entry into metrology will be removed and all benefits of this technology will be available for the user. (authors)

Time-of-flight SIMS/MSRI reflectron mass analyzer and method

Science.gov (United States)

Smentkowski, Vincent S.; Gruen, Dieter M.; Krauss, Alan R.; Schultz, J. Albert; Holecek, John C.

1999-12-28

A method and apparatus for analyzing the surface characteristics of a sample by Secondary Ion Mass Spectroscopy (SIMS) and Mass Spectroscopy of Recoiled Ions (MSRI) is provided. The method includes detecting back scattered primary ions, low energy ejected species, and high energy ejected species by ion beam surface analysis techniques comprising positioning a ToF SIMS/MSRI mass analyzer at a predetermined angle .theta., where .theta. is the angle between the horizontal axis of the mass analyzer and the undeflected primary ion beam line, and applying a specific voltage to the back ring of the analyzer. Preferably, .theta. is less than or equal to about 120.degree. and, more preferably, equal to 74.degree.. For positive ion analysis, the extractor, lens, and front ring of the reflectron are set at negative high voltages (-HV). The back ring of the reflectron is set at greater than about +700V for MSRI measurements and between the range of about +15 V and about +50V for SIMS measurements. The method further comprises inverting the polarity of the potentials applied to the extractor, lens, front ring, and back ring to obtain negative ion SIMS and/or MSRI data.

[Calmette Hospital, Phnom Penh, Cambodia. Assessment of the implementation of the Medical Information System (SIM). Global analysis of the 1998 results].

Science.gov (United States)

Fabre-Teste, B; Sokha, O

1999-01-01

Calmette is a national university hospital with 220 adult beds. It has emergency, surgical, medical and gynecology and obstetrics departments, along with a radiology unit, a laboratory for medical analyses, a central pharmacy and an outpatient clinic. This hospital has an unusual statute, with managerial autonomy and a system of cost recovery that currently provides 64% of the hospital's income. Since 1994, it has benefited from a French cooperation program. The French NGO, Médecins du Monde, has been present at Calmette since 1990, providing support for , the indigent sector of the medical department. The aim of the Medical Information System (SIM) is to develop a simple, reliable and reproducible system so that, for every action undertaken at the hospital (hospitalization, day hospital and outpatient clinic) the following pieces of information are recorded: 1) the disease; 2) the type of patient; 3) the type of management; 4) the means used to treat the patient; 5) the cost. Data are collected and analyzed using programs created with EPIINFO software (CDC, WHO), using the EPIGLUE module. In 1998, 10,814 admissions were recorded at Calmette Hospital, 7,811 (72.2%) of which were to the Emergency Department and 3,003 (27.2%) of which were direct admissions to other wards. We analyzed 10,603 (95%) computerized medical summaries (RMI). About 50% of beds were occupied in the maternity and gynecology ward whereas almost 90% of beds were occupied in the surgical and emergency wards. AIDS and tuberculosis were the conditions most frequently treated by the medical department, despite a marked increase in more specialized areas of medicine such as cardiology and diabetology. The surgical department reflected the concentration on emergency services of the hospital, with cranial traumatism the primary reason for admission for the hospital as a whole. The mean age of patients was 27 years for the maternity ward and 49 years for the medicine A ward. The mortality rate was

Did J. Marion Sims deliberately addict his first fistula patients to opium?

Science.gov (United States)

Wall, L Lewis

2007-07-01

American surgeon J. Marion Sims (1813-83) is regarded by many modern authors as a controversial figure because he carried out a series of experimental surgeries on enslaved African American women between 1846 and 1849 in an attempt to cure them of vesicovaginal fistulas, which they had all developed as a result of prolonged obstructed labor. He operated on one woman, Anarcha Westcott, thirty times before he successfully closed her fistula. Sims performed these fistula repair operations without benefit of anesthesia but gave these women substantial doses of opium afterwards. Several modern writers have alleged that Sims did this in order to addict them to the drug and thereby to enhance his control over them. This article examines the controversy surrounding Sims' use of postoperative opium in these enslaved surgical patients. The evidence suggests that although these women were probably tolerant to the doses of opium that he used, there is no evidence that he deliberately tried to addict them to this drug. Sims' use of postoperative opium appears to have been well supported by the therapeutic practices of his day, and the regimen that he used was enthusiastically supported by many contemporary surgeons.

In-situ virtual metrology for the silicon-dioxide etch rate by using optical emission spectroscopy data

International Nuclear Information System (INIS)

Kim, Boomsoo; Hong, Sangjeen

2014-01-01

As a useful tool for process control in a high volume semiconductor manufacturing environment, virtual metrology for the etch rate in a plasma etch process is investigated using optical emission spectroscopy (OES) data. Virtual metrology is a surrogate measurement taken from the process instead of from direct measurement, and it can provide in-situ metrology of a wafer's geometry from a predictive model. A statistical regression model that correlates the selected wavelengths of the optical emission spectra to the etch rate is established using the OES data collected over 20 experimental runs. In addition, an argon actinometry study is employed to quantify the OES data, and it provides valuable insight into the analysis of the OES data. The established virtual metrology model is further verified with an additional 20 runs of data. As a result, the virtual metrology model with both process recipe tool data and in-situ data shows higher prediction accuracy by as much as 56% compared with either the process recipe tool data or the in-situ data alone.

A Micro-Grid Simulator Tool (SGridSim) using Effective Node-to-Node Complex Impedance (EN2NCI) Models

Energy Technology Data Exchange (ETDEWEB)

Udhay Ravishankar; Milos manic

2013-08-01

This paper presents a micro-grid simulator tool useful for implementing and testing multi-agent controllers (SGridSim). As a common engineering practice it is important to have a tool that simplifies the modeling of the salient features of a desired system. In electric micro-grids, these salient features are the voltage and power distributions within the micro-grid. Current simplified electric power grid simulator tools such as PowerWorld, PowerSim, Gridlab, etc, model only the power distribution features of a desired micro-grid. Other power grid simulators such as Simulink, Modelica, etc, use detailed modeling to accommodate the voltage distribution features. This paper presents a SGridSim micro-grid simulator tool that simplifies the modeling of both the voltage and power distribution features in a desired micro-grid. The SGridSim tool accomplishes this simplified modeling by using Effective Node-to-Node Complex Impedance (EN2NCI) models of components that typically make-up a micro-grid. The term EN2NCI models means that the impedance based components of a micro-grid are modeled as single impedances tied between their respective voltage nodes on the micro-grid. Hence the benefit of the presented SGridSim tool are 1) simulation of a micro-grid is performed strictly in the complex-domain; 2) faster simulation of a micro-grid by avoiding the simulation of detailed transients. An example micro-grid model was built using the SGridSim tool and tested to simulate both the voltage and power distribution features with a total absolute relative error of less than 6%.

Metrology Sampling Strategies for Process Monitoring Applications

KAUST Repository

Vincent, Tyrone L.

2011-11-01

Shrinking process windows in very large scale integration semiconductor manufacturing have already necessitated the development of control systems capable of addressing sub-lot-level variation. Within-wafer control is the next milestone in the evolution of advanced process control from lot-based and wafer-based control. In order to adequately comprehend and control within-wafer spatial variation, inline measurements must be performed at multiple locations across the wafer. At the same time, economic pressures prompt a reduction in metrology, for both capital and cycle-time reasons. This paper explores the use of modeling and minimum-variance prediction as a method to select the sites for measurement on each wafer. The models are developed using the standard statistical tools of principle component analysis and canonical correlation analysis. The proposed selection method is validated using real manufacturing data, and results indicate that it is possible to significantly reduce the number of measurements with little loss in the information obtained for the process control systems. © 2011 IEEE.

Registration performance on EUV masks using high-resolution registration metrology

Science.gov (United States)

Steinert, Steffen; Solowan, Hans-Michael; Park, Jinback; Han, Hakseung; Beyer, Dirk; Scherübl, Thomas

2016-10-01

Next-generation lithography based on EUV continues to move forward to high-volume manufacturing. Given the technical challenges and the throughput concerns a hybrid approach with 193 nm immersion lithography is expected, at least in the initial state. Due to the increasing complexity at smaller nodes a multitude of different masks, both DUV (193 nm) and EUV (13.5 nm) reticles, will then be required in the lithography process-flow. The individual registration of each mask and the resulting overlay error are of crucial importance in order to ensure proper functionality of the chips. While registration and overlay metrology on DUV masks has been the standard for decades, this has yet to be demonstrated on EUV masks. Past generations of mask registration tools were not necessarily limited in their tool stability, but in their resolution capabilities. The scope of this work is an image placement investigation of high-end EUV masks together with a registration and resolution performance qualification. For this we employ a new generation registration metrology system embedded in a production environment for full-spec EUV masks. This paper presents excellent registration performance not only on standard overlay markers but also on more sophisticated e-beam calibration patterns.

Chemical Imaging of the Cell Membrane by NanoSIMS

International Nuclear Information System (INIS)

Weber, P.K.; Kraft, M.L.; Frisz, J.F.; Carpenter, K.J.; Hutcheon, I.D.

2010-01-01

The existence of lipid microdomains and their role in cell membrane organization are currently topics of great interest and controversy. The cell membrane is composed of a lipid bilayer with embedded proteins that can flow along the two-dimensional surface defined by the membrane. Microdomains, known as lipid rafts, are believed to play a central role in organizing this fluid system, enabling the cell membrane to carry out essential cellular processes, including protein recruitment and signal transduction. Lipid rafts are also implicated in cell invasion by pathogens, as in the case of the HIV. Therefore, understanding the role of lipid rafts in cell membrane organization not only has broad scientific implications, but also has practical implications for medical therapies. One of the major limitations on lipid organization research has been the inability to directly analyze lipid composition without introducing artifacts and at the relevant length-scales of tens to hundreds of nanometers. Fluorescence microscopy is widely used due to its sensitivity and specificity to the labeled species, but only the labeled components can be observed, fluorophores can alter the behavior of the lipids they label, and the length scales relevant to imaging cell membrane domains are between that probed by fluorescence resonance energy transfer (FRET) imaging (<10 nm) and the diffraction limit of light. Topographical features can be imaged on this length scale by atomic force microscopy (AFM), but the chemical composition of the observed structures cannot be determined. Immuno-labeling can be used to study the distribution of membrane proteins at high resolution, but not lipid composition. We are using imaging mass spectrometry by secondary ion mass spectrometry (SIMS) in concert with other high resolution imaging methods to overcome these limitations. The experimental approach of this project is to combine molecule-specific stable isotope labeling with high-resolution SIMS using a

SIMS and TEM study on oxide characteristics of Zircaloy

International Nuclear Information System (INIS)

Jung, Y. H.; Baek, J. H.; Kim, S. J.; Kim, K. H.; Choi, B. K.; Jung, Y. H.

1998-01-01

Long-term corrosion test, SIMS analysis, and TEM study were carried out to investigate the corrosion characteristics and corrosion mechanism of Zircaloy-4 in LiOH solution. The corrosion tests were performed in alkali solutions at 350 deg C for 500days. SIMS analysis was performed for the specimens prepared to have an equal oxide thickness to measure the cation content. TEM studies on the samples formed in various alkali solutions were also conducted. Based on the corrosion test, SIMS analysis, and TEM study, the cation is considered to control the corrosion in LiOH solution and its effect is dependent on the concentration of alkali and the oxide thickness. The slight acceleration of corrosion rate at a low concentration is thought to be caused by the cation incorporation into oxide while the significant acceleration at a high concentration is due to the transformation of oxide microstructure that would be induced by the cation incorporation

Relativistic quantum metrology: exploiting relativity to improve quantum measurement technologies.

Science.gov (United States)

Ahmadi, Mehdi; Bruschi, David Edward; Sabín, Carlos; Adesso, Gerardo; Fuentes, Ivette

2014-05-22

We present a framework for relativistic quantum metrology that is useful for both Earth-based and space-based technologies. Quantum metrology has been so far successfully applied to design precision instruments such as clocks and sensors which outperform classical devices by exploiting quantum properties. There are advanced plans to implement these and other quantum technologies in space, for instance Space-QUEST and Space Optical Clock projects intend to implement quantum communications and quantum clocks at regimes where relativity starts to kick in. However, typical setups do not take into account the effects of relativity on quantum properties. To include and exploit these effects, we introduce techniques for the application of metrology to quantum field theory. Quantum field theory properly incorporates quantum theory and relativity, in particular, at regimes where space-based experiments take place. This framework allows for high precision estimation of parameters that appear in quantum field theory including proper times and accelerations. Indeed, the techniques can be applied to develop a novel generation of relativistic quantum technologies for gravimeters, clocks and sensors. As an example, we present a high precision device which in principle improves the state-of-the-art in quantum accelerometers by exploiting relativistic effects.

TOF-SIMS characterization of planktonic foraminifera

International Nuclear Information System (INIS)

Vering, G.; Crone, C.; Bijma, J.; Arlinghaus, H.F.

2003-01-01

Oceanic sediment properties that are closely related to former environmental (e.g. climatic) parameters are called 'proxies'. Planktonic foraminifera are small protists which make up part of the plankton. Certain element concentrations, element ratios and isotopic ratios of their calcite shell found in the sediment can be used as proxies reflecting the state of the ocean during the life of the animal; they supply useful information for the reconstruction of environmental parameters. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to examine the inner and outer part of foraminiferal shells, as well as foraminiferal shells dissolved in HCl. High resolution elemental images and mass spectra were obtained from the foraminifera. The data show that TOF-SIMS is a useful technique for determining the elemental distribution and for measuring isotope ratios such as δ 11 B with high precision in a single foraminiferal shell

TOF-SIMS characterization of planktonic foraminifera

Energy Technology Data Exchange (ETDEWEB)

Vering, G.; Crone, C.; Bijma, J.; Arlinghaus, H.F

2003-01-15

Oceanic sediment properties that are closely related to former environmental (e.g. climatic) parameters are called 'proxies'. Planktonic foraminifera are small protists which make up part of the plankton. Certain element concentrations, element ratios and isotopic ratios of their calcite shell found in the sediment can be used as proxies reflecting the state of the ocean during the life of the animal; they supply useful information for the reconstruction of environmental parameters. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to examine the inner and outer part of foraminiferal shells, as well as foraminiferal shells dissolved in HCl. High resolution elemental images and mass spectra were obtained from the foraminifera. The data show that TOF-SIMS is a useful technique for determining the elemental distribution and for measuring isotope ratios such as {delta}{sup 11}B with high precision in a single foraminiferal shell.

A survey on coordinate metrology using dimensional X-ray CT

International Nuclear Information System (INIS)

Matsuzaki, Kazuya

2016-01-01

X-ray computed tomography (X-ray CT) has been occupying indispensable position in geometrical and dimensional measurements in industry, which is capable of measuring both external and internal dimensions of industrial products. Since dimensional X-ray CT has problems about ensuring traceability and estimating uncertainty, requirement of developing measurement standard for dimensional X-ray CT is increasing. Some of national metrology institutes (NMIs) including NMIJ have been working on developing measurement standard. In this report, the background of coordinate metrology using dimensional X-ray CT is reviewed. Then, measurement error sources are discussed. Finally, the plan to develop high accuracy dimensional X-ray CT is presented. (author)

An Assessment of Critical Dimension Small Angle X-ray Scattering Metrology for Advanced Semiconductor Manufacturing

Energy Technology Data Exchange (ETDEWEB)

Settens, Charles M. [State Univ. of New York (SUNY), Albany, NY (United States)

2015-01-01

Simultaneous migration of planar transistors to FinFET architectures, the introduction of a plurality of materials to ensure suitable electrical characteristics, and the establishment of reliable multiple patterning lithography schemes to pattern sub-10 nm feature sizes imposes formidable challenges to current in-line dimensional metrologies. Because the shape of a FinFET channel cross-section immediately influences the electrical characteristics, the evaluation of 3D device structures requires measurement of parameters beyond traditional critical dimension (CD), including their sidewall angles, top corner rounding and footing, roughness, recesses and undercuts at single nanometer dimensions; thus, metrologies require sub-nm and approaching atomic level measurement uncertainty. Synchrotron critical dimension small angle X-ray scattering (CD-SAXS) has unique capabilities to non-destructively monitor the cross-section shape of surface structures with single nanometer uncertainty and can perform overlay metrology to sub-nm uncertainty. In this dissertation, we perform a systematic experimental investigation using CD-SAXS metrology on a hierarchy of semiconductor 3D device architectures including, high-aspect-ratio contact holes, H2 annealed Si fins, and a series of grating type samples at multiple points along a FinFET fabrication process increasing in structural intricacy and ending with fully fabricated FinFET. Comparative studies between CD-SAXS metrology and other relevant semiconductor dimensional metrologies, particularly CDSEM, CD-AFM and TEM are used to determine physical limits of CD-SAXS approach for advanced semiconductor samples. CD-SAXS experimental tradeoffs, advice for model-dependent analysis and thoughts on the compatibility with a semiconductor manufacturing environment are discussed.

CystiSim - an agent-based model for Taenia solium transmission and control

DEFF Research Database (Denmark)

Braae, Uffe Christian; Devleesschauwer, Brecht; Gabriël, Sarah

2016-01-01

Taenia solium taeniosis/cysticercosis was declared eradicable by the International Task Force for Disease Eradication in 1993, but remains a neglected zoonosis. To assist in the attempt to regionally eliminate this parasite, we developed cystiSim, an agent-based model for T. solium transmission...... interventions in both hosts, mass drug administration to humans, and vaccination and treatment of pigs, have a high probability of success if coverage of 75% can be maintained over at least a four year period. In comparison with an existing mathematical model for T. solium transmission, cystiSim also includes...... and control. The model was developed in R and available as an R package (http://cran.r-project.org/package=cystiSim). cystiSim was adapted to an observed setting using field data from Tanzania, but adaptable to other settings if necessary. The model description adheres to the Overview, Design concepts...

Measuring up to the challenges of the 21st century. An international evaluation of the Centre for Metrology and Accreditation

Energy Technology Data Exchange (ETDEWEB)

Clapman, P.; Kaarls, R.; Temmes, M.

1997-04-01

The international evaluation of the Centre for Metrology and Accreditation (MIKES) is part of the process in which all relevant industrial and technology policy measures and organizations under the auspices of the Ministry of Trade and Industry (MTI) are being evaluated with the aim of improving their effectiveness. The overall conclusion of the evaluation is that MIKES is serving the country well. An effective national measurement system (FINMET) is being maintained which provides a wide range of calibration services covering most of the nation`s needs. The accreditation service (FINAS) is now well established, is operating effectively, and has good prospects for growth. The evaluators present, however, a number of proposals (including 33 specific recommendations) where they feel that the metrology and accreditation arrangements could be better-suited to meet future national and international challenges. According to the recommendations the Finnish quality policy framework should be developed in a consistent way. There is a need of a comprehensive governmental quality policy statement upon which the inter-ministry coordination and harmonization of various conformity assessment activities can be based. MIKES should retain its current status as an agency within MTI. The national measurement system should be more centralised and a new purpose-built national standards laboratory should be procured. The responsibility for legal metrology should be transferred to MIKES. The terms of reference and membership of Advisory Committee for Metrology, as well as the Advisory Committee for Accreditation should be revised to ensure wider representation of all relevant, and especially industrial interests

Quantitative SIMS Imaging of Agar-Based Microbial Communities.

Science.gov (United States)

Dunham, Sage J B; Ellis, Joseph F; Baig, Nameera F; Morales-Soto, Nydia; Cao, Tianyuan; Shrout, Joshua D; Bohn, Paul W; Sweedler, Jonathan V

2018-05-01

After several decades of widespread use for mapping elemental ions and small molecular fragments in surface science, secondary ion mass spectrometry (SIMS) has emerged as a powerful analytical tool for molecular imaging in biology. Biomolecular SIMS imaging has primarily been used as a qualitative technique; although the distribution of a single analyte can be accurately determined, it is difficult to map the absolute quantity of a compound or even to compare the relative abundance of one molecular species to that of another. We describe a method for quantitative SIMS imaging of small molecules in agar-based microbial communities. The microbes are cultivated on a thin film of agar, dried under nitrogen, and imaged directly with SIMS. By use of optical microscopy, we show that the area of the agar is reduced by 26 ± 2% (standard deviation) during dehydration, but the overall biofilm morphology and analyte distribution are largely retained. We detail a quantitative imaging methodology, in which the ion intensity of each analyte is (1) normalized to an external quadratic regression curve, (2) corrected for isomeric interference, and (3) filtered for sample-specific noise and lower and upper limits of quantitation. The end result is a two-dimensional surface density image for each analyte. The sample preparation and quantitation methods are validated by quantitatively imaging four alkyl-quinolone and alkyl-quinoline N-oxide signaling molecules (including Pseudomonas quinolone signal) in Pseudomonas aeruginosa colony biofilms. We show that the relative surface densities of the target biomolecules are substantially different from values inferred through direct intensity comparison and that the developed methodologies can be used to quantitatively compare as many ions as there are available standards.

Hydraulic Arm Modeling via Matlab SimHydraulics

Czech Academy of Sciences Publication Activity Database

Věchet, Stanislav; Krejsa, Jiří

2009-01-01

Roč. 16, č. 4 (2009), s. 287-296 ISSN 1802-1484 Institutional research plan: CEZ:AV0Z20760514 Keywords : simulatin modeling * hydraulics * SimHydraulics Subject RIV: JD - Computer Applications, Robotics

SIMS analysis: Development and evaluation 1995 summary report

International Nuclear Information System (INIS)

Groenewold, G.S.; Appelhans, A.D.; Ingram, J.C.; Delmore, J.E.; Dahl, D.A.

1995-10-01

Secondary ion mass spectrometry (SIMS) was evaluated for characterizing Hg salts. It was found that sulfate and chloride species could be identified directly without sample preparation. Mercuric oxide could be identified by complexation with formic acid. Hg nitrates could be identified by complexation with cyclohexylamine (CHA). Laser desorption ion trap MS was evaluated for characterizing EDTA on environmental samples. No intact EDTA ions were observed, but a series of EDTA fragment ions were visible, particularly on basalt and soil. An ion trap SIMS was developed: a perrhenate ion gun was interfaced to a Teledyne ion trap spectrometer, and the entire device was mounted on a cart. The technology was demonstrated using a prototype ion trap SIMS instrument for detecting Hg·CHA complexes formed from nitrate salts. Intensity of the ion gun was improved, and the surface damage of the particle was small, and ion gun technology transfer to Phi-Evans, Inc. is being considered. Two technology end users are at INEL's Central Facilities Area 674 pond and acid pit of the Radioactive Waste Management Complex; target problem at both sites is the need for Hg speciation on soil samples

A Sim(2 invariant dimensional regularization

Directory of Open Access Journals (Sweden)

J. Alfaro

2017-09-01

Full Text Available We introduce a Sim(2 invariant dimensional regularization of loop integrals. Then we can compute the one loop quantum corrections to the photon self energy, electron self energy and vertex in the Electrodynamics sector of the Very Special Relativity Standard Model (VSRSM.

TOF-SIMS Analysis of Red Color Inks of Writing and Printing Tools on Questioned Documents.

Science.gov (United States)

Lee, Jihye; Nam, Yun Sik; Min, Jisook; Lee, Kang-Bong; Lee, Yeonhee

2016-05-01

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a well-established surface technique that provides both elemental and molecular information from several monolayers of a sample surface while also allowing depth profiling or image mapping to be performed. Static TOF-SIMS with improved performances has expanded the application of TOF-SIMS to the study of a variety of organic, polymeric, biological, archaeological, and forensic materials. In forensic investigation, the use of a minimal sample for the analysis is preferable. Although the TOF-SIMS technique is destructive, the probing beams have microsized diameters so that only small portion of the questioned sample is necessary for the analysis, leaving the rest available for other analyses. In this study, TOF-SIMS and attenuated total reflectance Fourier transform infrared (ATR-FTIR) were applied to the analysis of several different pen inks, red sealing inks, and printed patterns on paper. The overlapping areas of ballpoint pen writing, red seal stamping, and laser printing in a document were investigated to identify the sequence of recording. The sequence relations for various cases were determined from the TOF-SIMS mapping image and the depth profile. TOF-SIMS images were also used to investigate numbers or characters altered with two different red pens. TOF-SIMS was successfully used to determine the sequence of intersecting lines and the forged numbers on the paper. © 2016 American Academy of Forensic Sciences.

Analysis and imaging of biocidal agrochemicals using ToF-SIMS.

Science.gov (United States)

Converso, Valerio; Fearn, Sarah; Ware, Ecaterina; McPhail, David S; Flemming, Anthony J; Bundy, Jacob G

2017-09-06

ToF-SIMS has been increasingly widely used in recent years to look at biological matrices, in particular for biomedical research, although there is still a lot of development needed to maximise the value of this technique in the life sciences. The main issue for biological matrices is the complexity of the mass spectra and therefore the difficulty to specifically and precisely detect analytes in the biological sample. Here we evaluated the use of ToF-SIMS in the agrochemical field, which remains a largely unexplored area for this technique. We profiled a large number of biocidal active ingredients (herbicides, fungicides, and insecticides); we then selected fludioxonil, a halogenated fungicide, as a model compound for more detailed study, including the effect of co-occurring biomolecules on detection limits. There was a wide range of sensitivity of the ToF-SIMS for the different active ingredient compounds, but fludioxonil was readily detected in real-world samples (wheat seeds coated with a commercial formulation). Fludioxonil did not penetrate the seed to any great depth, but was largely restricted to a layer coating the seed surface. ToF-SIMS has clear potential as a tool for not only detecting biocides in biological samples, but also mapping their distribution.

Importance of education and competence maintenance in metrology field (measurement science)

International Nuclear Information System (INIS)

Dobiliene, J; Meskuotiene, A

2015-01-01

For certain tasks in metrology field trained employers might be necessary to fulfill specific requirements. It is important to pay attention that metrologists are responsible for fluent work of devices that belong to huge variety of vide spectrum of measurements. People who perform measurements (that are related to our safety, security or everyday life) with reliable measuring instruments must be sure for trueness of their results or conclusions. So with the purpose to reach the harmony between the ordinary man and his used means it is very important to ensure competence of specialists that are responsible for mentioned harmony implementation. Usually these specialists have a university degree and perform highly specified tasks in science, industry or laboratories. Their task is quite narrow. For example, type approval of measuring instrument or calibration and verification. Due to the fact that the number of such employers and their tasks is relatively small in the field of legal metrology, this paper focuses on the significance of training and qualification of legal metrology officers

National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN; Laboratorio Nacional de Metrologia das Radiacoes Ionizantes

Energy Technology Data Exchange (ETDEWEB)

NONE

1993-12-31

The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs.

National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN; Laboratorio Nacional de Metrologia das Radiacoes Ionizantes

Energy Technology Data Exchange (ETDEWEB)

NONE

1992-12-31

The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs.

SimHap GUI: an intuitive graphical user interface for genetic association analysis.

Science.gov (United States)

Carter, Kim W; McCaskie, Pamela A; Palmer, Lyle J

2008-12-25

Researchers wishing to conduct genetic association analysis involving single nucleotide polymorphisms (SNPs) or haplotypes are often confronted with the lack of user-friendly graphical analysis tools, requiring sophisticated statistical and informatics expertise to perform relatively straightforward tasks. Tools, such as the SimHap package for the R statistics language, provide the necessary statistical operations to conduct sophisticated genetic analysis, but lacks a graphical user interface that allows anyone but a professional statistician to effectively utilise the tool. We have developed SimHap GUI, a cross-platform integrated graphical analysis tool for conducting epidemiological, single SNP and haplotype-based association analysis. SimHap GUI features a novel workflow interface that guides the user through each logical step of the analysis process, making it accessible to both novice and advanced users. This tool provides a seamless interface to the SimHap R package, while providing enhanced functionality such as sophisticated data checking, automated data conversion, and real-time estimations of haplotype simulation progress. SimHap GUI provides a novel, easy-to-use, cross-platform solution for conducting a range of genetic and non-genetic association analyses. This provides a free alternative to commercial statistics packages that is specifically designed for genetic association analysis.

Calibration technique and study on metrological characteristics of a high-voltage inverse square-law function generator

International Nuclear Information System (INIS)

Popov, V.P.; Semenov, A.L.

1987-01-01

The calibration technique is described, and the metrological characteristics of a high-voltage generator of the inverse-quadratic function (HGF), being a functional unit of the diagnostic system of an electrodynamic analyser of a ionic component of a laser plasma, is analysed. The results of HGF testing in the range of time constants of the τ=(5-25)μs function are given. Analysis of metrologic and experimental characteristics shows, that HGF with automatic calibration has quite high accurate parameters. The high accuracy of function generation is provided with the possibility of calibration and adjustment conduction under experimental working conditions. Increase of the generated pulse amplitude to several tens of kilovelts is possible. Besides, the possibility of timely function adjustment to the necessary parameter (τ) increases essentially the HGF functional possibilities

Metrology test object for dimensional verification in additive manufacturing of metals for biomedical applications.

Science.gov (United States)

Teeter, Matthew G; Kopacz, Alexander J; Nikolov, Hristo N; Holdsworth, David W

2015-01-01

Additive manufacturing continues to increase in popularity and is being used in applications such as biomaterial ingrowth that requires sub-millimeter dimensional accuracy. The purpose of this study was to design a metrology test object for determining the capabilities of additive manufacturing systems to produce common objects, with a focus on those relevant to medical applications. The test object was designed with a variety of features of varying dimensions, including holes, cylinders, rectangles, gaps, and lattices. The object was built using selective laser melting, and the produced dimensions were compared to the target dimensions. Location of the test objects on the build plate did not affect dimensions. Features with dimensions less than 0.300 mm did not build or were overbuilt to a minimum of 0.300 mm. The mean difference between target and measured dimensions was less than 0.100 mm in all cases. The test object is applicable to multiple systems and materials, tests the effect of location on the build, uses a minimum of material, and can be measured with a variety of efficient metrology tools (including measuring microscopes and micro-CT). Investigators can use this test object to determine the limits of systems and adjust build parameters to achieve maximum accuracy. © IMechE 2014.

Optical antennas for far and near field metrology

NARCIS (Netherlands)

Silvestri, F.; Bernal Arango, F.; Vendel, K.J.A.; Gerini, G.; Bäumer, S.M.B.; Koenderink, A.F.

2016-01-01

This paper presents the use of optical antennas in metrology scenarios. Two design concepts are presented: dielectric nanoresonator arrays and plasmonic nanoantennas arrays. The first ones are able to focus an incident light beam at an arbitrary focal plane. The nanoantennas arrays can be employed

Subcellular boron and fluorine distributions with SIMS ion microscopy in BNCT and cancer research

Energy Technology Data Exchange (ETDEWEB)

Subhash Chandra

2008-05-30

The development of a secondary ion mass spectrometry (SIMS) based technique of Ion Microscopy in boron neutron capture therapy (BNCT) was the main goal of this project, so that one can study the subcellular location of boron-10 atoms and their partitioning between the normal and cancerous tissue. This information is fundamental for the screening of boronated drugs appropriate for neutron capture therapy of cancer. Our studies at Cornell concentrated mainly on studies of glioblastoma multiforme (GBM). The early years of the grant were dedicated to the development of cryogenic methods and correlative microscopic approaches so that a reliable subcellular analysis of boron-10 atoms can be made with SIMS. In later years SIMS was applied to animal models and human tissues of GBM for studying the efficacy of potential boronated agents in BNCT. Under this grant the SIMS program at Cornell attained a new level of excellence and collaborative SIMS studies were published with leading BNCT researchers in the U.S.

Subcellular boron and fluorine distributions with SIMS ion microscopy in BNCT and cancer research

International Nuclear Information System (INIS)

Subhash, Chandra

2008-01-01

The development of a secondary ion mass spectrometry (SIMS) based technique of Ion Microscopy in boron neutron capture therapy (BNCT) was the main goal of this project, so that one can study the subcellular location of boron-10 atoms and their partitioning between the normal and cancerous tissue. This information is fundamental for the screening of boronated drugs appropriate for neutron capture therapy of cancer. Our studies at Cornell concentrated mainly on studies of glioblastoma multiforme (GBM). The early years of the grant were dedicated to the development of cryogenic methods and correlative microscopic approaches so that a reliable subcellular analysis of boron-10 atoms can be made with SIMS. In later years SIMS was applied to animal models and human tissues of GBM for studying the efficacy of potential boronated agents in BNCT. Under this grant the SIMS program at Cornell attained a new level of excellence and collaborative SIMS studies were published with leading BNCT researchers in the U.S.

Surface Slope Metrology on Deformable Soft X-ray Mirrors

International Nuclear Information System (INIS)

Yuan, Sheng; Yashchuk, Valeriy V.; Goldberg, Kenneth A.; Celestre, Rich; Church, Matthew; McKinney, Wayne R.; Morrison, Greg; Warwick, Tony

2010-01-01

We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situ visible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

Surface Slope Metrology on Deformable Soft X-ray Mirrors

International Nuclear Information System (INIS)

Yuan, S.; Yashchuk, V.V.; Goldberg, K.A.; Celestre, R.; Church, M.; McKinney, W.R.; Morrison, G.; Warwick, T.

2009-01-01

We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situvisible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

Metrology of the radon in air volume activity at the italian radon reference chamber

Energy Technology Data Exchange (ETDEWEB)

Sciocchetti, G.; Cotellessa, G.; Soldano, E.; Pagliari, M. [Istituto Nazionale di Metrologia delle Radiazioni Ionizzanti, ENEA Centro Ricerche Casaccia Roma (Italy)

2006-07-01

The approach of the Italian National Institute of Ionising Radiations (I.N.M.R.I.-ENEA) on radon metrology has been based on a complete and integrated system which can be used to calibrate the main types of {sup 222}Rn in air measuring instruments with international traceability. The Italian radon reference chamber is a research and calibration facility developed at the Casaccia Research Center in Roma. This facility has an inner volume of one m{sup 3}. The wall is a cylindrical stainless steel vessel coupled with an automated climate apparatus operated both at steady and dynamic conditions. The control and data acquisition equipment is based on Radotron system, developed to automate the multitasking management of different sets of radon monitors and climatic sensors. A novel approach for testing passive radon monitors with an alpha track detector exposure standard has been developed. It is based on the direct measurement of radon exposure with a set of passive integrating monitors based on the new ENEA piston radon exposure meter. This paper describes the methodological approach on radon metrology, the status-of-art of experimental apparatus and the standardization procedures. (authors)

Metrology of the radon in air volume activity at the italian radon reference chamber

International Nuclear Information System (INIS)

Sciocchetti, G.; Cotellessa, G.; Soldano, E.; Pagliari, M.

2006-01-01

The approach of the Italian National Institute of Ionising Radiations (I.N.M.R.I.-ENEA) on radon metrology has been based on a complete and integrated system which can be used to calibrate the main types of 222 Rn in air measuring instruments with international traceability. The Italian radon reference chamber is a research and calibration facility developed at the Casaccia Research Center in Roma. This facility has an inner volume of one m 3 . The wall is a cylindrical stainless steel vessel coupled with an automated climate apparatus operated both at steady and dynamic conditions. The control and data acquisition equipment is based on Radotron system, developed to automate the multitasking management of different sets of radon monitors and climatic sensors. A novel approach for testing passive radon monitors with an alpha track detector exposure standard has been developed. It is based on the direct measurement of radon exposure with a set of passive integrating monitors based on the new ENEA piston radon exposure meter. This paper describes the methodological approach on radon metrology, the status-of-art of experimental apparatus and the standardization procedures. (authors)

Investigation of the deuterium solubility in niobium using secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Zuechner, H.; Bruening, T.

1991-01-01

From SIMS measurements on deuterium charged niobium foils a pressure-composition isotherm was obtained. The plateau pressure of the α-β-two-phase region is in good agreement with that known from electrochemical p-n isotherm measurements. The solubility in the homogeneous α-phase measured by SIMS, however, is enhanced compared with the electrochemical p-n isotherm, i.e. the homogeneous α-phase is broadened. These results are due to the ion bombardment causing a lattice distortion within the near surface region during the SIMS experiment. (orig.)

Modeling the nuclide migration and dose estimating using GoldSim

International Nuclear Information System (INIS)

Xiong Xiaowei

2010-01-01

Nuclide migration of the high-level waste (HLW) repository in the near-and far-field as well as a transport through a biosphere under reference scenario has been modeled by utilizing GoldSim. The concept design of engineered barrier system (EBS), geosphere and biosphere characteristics are derived from H12 in Japan. The calculated results are consistent with H12 report, which can be considered as technical basis for the safety assessment of China HLW disposal. (authors)

Imaging and differentiation of mouse embryo tissues by ToF-SIMS

Energy Technology Data Exchange (ETDEWEB)

Wu, L; Lu, X; Kulp, K; Knize, M; Berman, E; Nelson, E; Felton, J; Wu, K J