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Sample records for depth profiling techniques

  1. Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

    International Nuclear Information System (INIS)

    Alfeld, Matthias; Broekaert, José A.C.

    2013-01-01

    Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings

  2. Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

    Energy Technology Data Exchange (ETDEWEB)

    Alfeld, Matthias, E-mail: matthias.alfeld@desy.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany); University of Antwerp, Department of Chemistry, Groenenbrogerlaan 171, B-2020 Antwerp (Belgium); Broekaert, José A.C., E-mail: jose.broekaert@chemie.uni-hamburg.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany)

    2013-10-01

    Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings.

  3. Depth-profiling by confocal Raman microscopy (CRM): data correction by numerical techniques.

    Science.gov (United States)

    Tomba, J Pablo; Eliçabe, Guillermo E; Miguel, María de la Paz; Perez, Claudio J

    2011-03-01

    The data obtained in confocal Raman microscopy (CRM) depth profiling experiments with dry optics are subjected to significant distortions, including an artificial compression of the depth scale, due to the combined influence of diffraction, refraction, and instrumental effects that operate on the measurement. This work explores the use of (1) regularized deconvolution and (2) the application of simple rescaling of the depth scale as methodologies to obtain an improved, more precise, confocal response. The deconvolution scheme is based on a simple predictive model for depth resolution and the use of regularization techniques to minimize the dramatic oscillations in the recovered response typical of problem inversion. That scheme is first evaluated using computer simulations on situations that reproduce smooth and sharp sample transitions between two materials and finally it is applied to correct genuine experimental data, obtained in this case from a sharp transition (planar interface) between two polymeric materials. It is shown that the methodology recovers very well most of the lost profile features in all the analyzed situations. The use of simple rescaling appears to be only useful for correcting smooth transitions, particularly those extended over distances larger than those spanned by the operative depth resolution, which limits the strategy to the study of profiles near the sample surface. However, through computer simulations, it is shown that the use of water immersion objectives may help to reduce optical distortions and to expand the application window of this simple methodology, which could be useful, for instance, to safely monitor Fickean sorption/desorption of penetrants in polymer films/coatings in a nearly noninvasive way.

  4. Hardness depth profiling of case hardened steels using a three-dimensional photothermal technique

    International Nuclear Information System (INIS)

    Qu Hong; Wang Chinhua; Guo Xinxin; Mandelis, Andreas

    2010-01-01

    A method of retrieving thermophysical depth profiles of continuously inhomogeneous materials is presented both theoretically and experimentally using the three-dimensional (3-D) photothermal radiometry. A 3-D theoretical model suitable for characterizing solids with arbitrary continuously varying thermophysical property depth profiles and finite (collimated or focused) laser beam spotsize is developed. A numerical fitting algorithm to retrieve the thermophysical profile was demonstrated with three case hardened steel samples. The reconstructed thermal conductivity depth profiles were found to be well anti-correlated with microhardness profiles obtained with the conventional indenter method.

  5. Depth profile analysis of thin TiOxNy films using standard ion beam analysis techniques and HERDA

    International Nuclear Information System (INIS)

    Markwitz, A.; Dytlewski, N.; Cohen, D.

    1999-01-01

    Ion beam assisted deposition is used to fabricate thin titanium oxynitride films (TiO x N y ) at Industrial Research (typical film thickness 100nm). At the Institute of Geological and Nuclear Sciences, the thin films are analysed using non-destructive standard ion beam analysis (IBA) techniques. High-resolution titanium depth profiles are measured with RBS using 1.5MeV 4 He + ions. Non-resonant nuclear reaction analysis (NRA) is performed for investigating the amounts of O and N in the deposited films using the reactions 16 O(d,p) 17 O at 920 keV and 14 N(d,α) 12 C at 1.4 MeV. Using a combination of these nuclear techniques, the stoichiometry as well as the thickness of the layers is revealed. However, when oxygen and nitrogen depth profiles are required for investigating stoichiometric changes in the films, additional nuclear analysis techniques such as heavy ion elastic recoil detection (HERDA) have to be applied. With HERDA, depth profiles of N, O, and Ti are measured simultaneously. In this paper comparative IBA measurement s of TiO x N y films with different compositions are presented and discussed

  6. Use of nuclear reactions and ion channeling techniques for depth profiling hydrogen isotopes in solids

    International Nuclear Information System (INIS)

    Appleton, B.R.

    1979-01-01

    Hydrogen has always played a preeminent role in materials science because it so readily alters the physical and chemical properties of materials. However, it is often difficult to determine its role because it is one of the most elusive constituents to detect. More recently hydrogen detection has become necessary in numerous energy-related fields. In fusion energy one must understand plasma particle (hydrogen isotope) recycling, trapping and reemission, as well as the effects of hydrogen on the materials properties of first wall structures in plasma devices (i.e., hydrogen embrittlement, sputtering, blistering, etc.). In geology the presence of hydrogen in various forms alters the mechanical properties of many minerals in the earth's crust and enters directly into studies of tectonic processes. Evaluation of hydrogen in moon rocks increases our understanding of solar wind activity. In solar energy, hydrogen plays an important role in amorphous silicon used in fabricating solar cells. Detection of hydrogen is clearly important in the fossil fuel area. Many of the conventional elemental analysis techniques are not directly applicable to hydrogen determination and others can only detect hydrogen when it is in combination with other elements (i.e., H 2 O, OH, etc.). In this paper we discuss the use of ion beam techniques for obtaining quantitative depth information on hydrogen in materials and discuss the application of these techniques to several problems important in some of the areas mentioned

  7. Depth profiling of hydrogen in ferritic/martensitic steels by means of a tritium imaging plate technique

    International Nuclear Information System (INIS)

    Otsuka, Teppei; Tanabe, Tetsuo

    2013-01-01

    Highlights: ► We applied a tritium imaging plate technique to depth profiling of hydrogen in bulk. ► Changes of hydrogen depth profiles in the steel by thermal annealing were examined. ► We proposed a release model of plasma-loaded hydrogen in the steel. ► Hydrogen is trapped at trapping sites newly developed by plasma loading. ► Hydrogen is also trapped at surface oxides and hardly desorbed by thermal annealing. -- Abstract: In order to understand how hydrogen loaded by plasma in F82H is removed by annealing at elevated temperatures in vacuum, depth profiles of plasma-loaded hydrogen were examined by means of a tritium imaging plate technique. Owing to large hydrogen diffusion coefficients in F82H, the plasma-loaded hydrogen easily penetrates into a deeper region becoming solute hydrogen and desorbs by thermal annealing in vacuum. However the plasma-loading creates new hydrogen trapping sites having larger trapping energy than that for the intrinsic sites beyond the projected range of the loaded hydrogen. Some surface oxides also trap an appreciable amount of hydrogen which is more difficult to remove by the thermal annealing

  8. Applications of positron depth profiling

    International Nuclear Information System (INIS)

    Hakvoort, R.A.

    1993-01-01

    In this thesis some contributions of the positron-depth profiling technique to materials science have been described. Following studies are carried out: Positron-annihilation measurements on neon-implanted steel; Void creation in silicon by helium implantation; Density of vacancy-type defects present in amorphous silicon prepared by ion implantation; Measurements of other types of amorphous silicon; Epitaxial cobalt disilicide prepared by cobalt outdiffusion. Positron-annihilation experiments on low-pressure CVD silicon-nitride films. (orig./MM)

  9. Applications of positron depth profiling

    Energy Technology Data Exchange (ETDEWEB)

    Hakvoort, R A

    1993-12-23

    In this thesis some contributions of the positron-depth profiling technique to materials science have been described. Following studies are carried out: Positron-annihilation measurements on neon-implanted steel; Void creation in silicon by helium implantation; Density of vacancy-type defects present in amorphous silicon prepared by ion implantation; Measurements of other types of amorphous silicon; Epitaxial cobalt disilicide prepared by cobalt outdiffusion. Positron-annihilation experiments on low-pressure CVD silicon-nitride films. (orig./MM).

  10. Depth profiling of residual activity of ^{237}U fragments as a range verification technique for ^{238}U primary ion beam

    Directory of Open Access Journals (Sweden)

    I. Strašík

    2012-07-01

    Full Text Available Experimental and simulation data concerning fragmentation of ^{238}U ion beam in aluminum, copper, and stainless-steel targets with the initial energy 500 and 950  MeV/u are collected in the paper. A range-verification technique based on depth profiling of residual activity is presented. The irradiated targets were constructed in the stacked-foil geometry and analyzed using gamma-ray spectroscopy. One of the purposes of these experiments was depth profiling of residual activity of induced nuclides and projectile fragments. Among the projectile fragments, special attention is paid to the ^{237}U isotope that has a range very close to the range of the primary ^{238}U ions. Therefore, the depth profiling of the ^{237}U isotope can be utilized for experimental verification of the ^{238}U primary-beam range, which is demonstrated and discussed in the paper. The experimental data are compared with computer simulations by FLUKA, SRIM, and ATIMA, as well as with complementary experiments.

  11. Shave-off depth profiling: Depth profiling with an absolute depth scale

    International Nuclear Information System (INIS)

    Nojima, M.; Maekawa, A.; Yamamoto, T.; Tomiyasu, B.; Sakamoto, T.; Owari, M.; Nihei, Y.

    2006-01-01

    Shave-off depth profiling provides profiling with an absolute depth scale. This method uses a focused ion beam (FIB) micro-machining process to provide the depth profile. We show that the shave-off depth profile of a particle reflected the spherical shape of the sample and signal intensities had no relationship to the depth. Through the introduction of FIB micro-sampling, the shave-off depth profiling of a dynamic random access memory (DRAM) tip was carried out. The shave-off profile agreed with a blue print from the manufacturing process. Finally, shave-off depth profiling is discussed with respect to resolutions and future directions

  12. Positron depth profiling

    International Nuclear Information System (INIS)

    Coleman, P.

    2001-01-01

    Wide-ranging studies of defects below the surface of semiconductor structures have been performed at the University of Bath, in collaboration with the University of Surrey Centre for Ion Beam Applications and with members of research teams at a number of UK universities. Positron implantation has been used in conjunction with other spectroscopies such as RBS-channeling and SIMS, and electrical characterisation methods. Research has ranged from the development of a positron-based technique to monitor the in situ annealing of near-surface open-volume defects to the provision of information on defects to comprehensive diagnostic investigations of specific device structures. We have studied Si primarily but not exclusively; e.g., we have investigated ion-implanted SiC and SiO 2 /GaAs structures. Of particular interest are the applications of positron annihilation spectroscopy to ion-implanted semiconductors, where by linking ion dose to vacancy-type defect concentration one can obtain information on ion dose and uniformity with a sensitivity not achievable by standard techniques. A compact, user-friendly positron beam system is currently being developed at Bath, in collaboration with SCRIBA, with the intention of application in an industrial environment. (orig.)

  13. Hydrogen depth profiling using elastic recoil detection

    International Nuclear Information System (INIS)

    Doyle, B.L.; Peercy, P.S.

    1979-01-01

    The elastic recoil detection (ERD) analysis technique for H profiling in the near surface regions of solids is described. ERD is shown to have the capability of detecting H and its isotopes down to concentrations of approx. 0.01 at. % with a depth resolution of a few hundred angstroms. Is is demonstrated that 2.4-MeV He ions can be used successfully to profile 1 H and 2 D using this technique. 12 figures

  14. Sputtering as a means of depth profiling

    International Nuclear Information System (INIS)

    Whitton, J.L.

    1978-01-01

    Probably the most common technique for determination of depth profiles by sputtering is that of secondary ion mass spectrometry. Many problems occur in the important step of converting the time (of sputtering) scale to a depth scale and these problems arise before the secondary ions are ejected. An attempt is made to present a comprehensive list of the effects that should be taken into consideration in the use of sputtering as a means of depth profiling. The various parameters liable to affect the depth profile measurements are listed in four sections: beam conditions; target conditions; experimental environment; and beam-target interactions. The effects are discussed and where interplay occurs, cross-reference is made and examples are provided where possible. (B.R.H.)

  15. Shallow surface depth profiling with atomic resolution

    International Nuclear Information System (INIS)

    Xi, J.; Dastoor, P.C.; King, B.V.; O'Connor, D.J.

    1999-01-01

    It is possible to derive atomic layer-by-layer composition depth profiles from popular electron spectroscopic techniques, such as X-ray photoelectron spectroscopy (XPS) or Auger electron spectroscopy (AES). When ion sputtering assisted AES or XPS is used, the changes that occur during the establishment of the steady state in the sputtering process make these techniques increasingly inaccurate for depths less than 3nm. Therefore non-destructive techniques of angle-resolved XPS (ARXPS) or AES (ARAES) have to be used in this case. In this paper several data processing algorithms have been used to extract the atomic resolved depth profiles of a shallow surface (down to 1nm) from ARXPS and ARAES data

  16. Possibilities of LA-ICP-MS technique for the spatial elemental analysis of the recent fish scales: Line scan vs. depth profiling

    International Nuclear Information System (INIS)

    Hola, Marketa; Kalvoda, Jiri; Novakova, Hana; Skoda, Radek; Kanicky, Viktor

    2011-01-01

    LA-ICP-MS and solution based ICP-MS in combination with electron microprobe are presented as a method for the determination of the elemental spatial distribution in fish scales which represent an example of a heterogeneous layered bone structure. Two different LA-ICP-MS techniques were tested on recent common carp (Cyprinus carpio) scales: (a)A line scan through the whole fish scale perpendicular to the growth rings. The ablation crater of 55 μm width and 50 μm depth allowed analysis of the elemental distribution in the external layer. Suitable ablation conditions providing a deeper ablation crater gave average values from the external HAP layer and the collagen basal plate. (b)Depth profiling using spot analysis was tested in fish scales for the first time. Spot analysis allows information to be obtained about the depth profile of the elements at the selected position on the sample. The combination of all mentioned laser ablation techniques provides complete information about the elemental distribution in the fish scale samples. The results were compared with the solution based ICP-MS and EMP analyses. The fact that the results of depth profiling are in a good agreement both with EMP and PIXE results and, with the assumed ways of incorporation of the studied elements in the HAP structure, suggests a very good potential for this method.

  17. Possibilities of LA-ICP-MS technique for the spatial elemental analysis of the recent fish scales: Line scan vs. depth profiling

    Energy Technology Data Exchange (ETDEWEB)

    Hola, Marketa [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic); Kalvoda, Jiri, E-mail: jkalvoda@centrum.cz [Department of Geological Sciences, Masaryk University of Brno, Kotlarska 2, 611 37 Brno (Czech Republic); Novakova, Hana [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic); Skoda, Radek [Department of Geological Sciences, Masaryk University of Brno, Kotlarska 2, 611 37 Brno (Czech Republic); Kanicky, Viktor [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic)

    2011-01-01

    LA-ICP-MS and solution based ICP-MS in combination with electron microprobe are presented as a method for the determination of the elemental spatial distribution in fish scales which represent an example of a heterogeneous layered bone structure. Two different LA-ICP-MS techniques were tested on recent common carp (Cyprinus carpio) scales: (a)A line scan through the whole fish scale perpendicular to the growth rings. The ablation crater of 55 {mu}m width and 50 {mu}m depth allowed analysis of the elemental distribution in the external layer. Suitable ablation conditions providing a deeper ablation crater gave average values from the external HAP layer and the collagen basal plate. (b)Depth profiling using spot analysis was tested in fish scales for the first time. Spot analysis allows information to be obtained about the depth profile of the elements at the selected position on the sample. The combination of all mentioned laser ablation techniques provides complete information about the elemental distribution in the fish scale samples. The results were compared with the solution based ICP-MS and EMP analyses. The fact that the results of depth profiling are in a good agreement both with EMP and PIXE results and, with the assumed ways of incorporation of the studied elements in the HAP structure, suggests a very good potential for this method.

  18. Understanding of CO{sub 2} interaction with thermally grown SiO{sub 2} on Si using IBA depth profiling techniques

    Energy Technology Data Exchange (ETDEWEB)

    Deokar, Geetanjali; D’Angelo, Marie; Briand, Emrick [INSP, UPMC, CNRS UMR 7588, 4 Place Jussieu, Paris F-75005 (France); Deville Cavellin, Catherine, E-mail: deville@univ-paris12.fr [INSP, UPMC, CNRS UMR 7588, 4 Place Jussieu, Paris F-75005 (France); Faculté des Sciences et Technologie UPEC, 61 Av., De Gaulle, Créteil F-94010 (France)

    2013-06-01

    Interactions between CO{sub 2} and SiO{sub 2} films thermally grown on Si have been studied using {sup 18}O and {sup 13}C as isotopic tracers associated with ion beam analysis (IBA) depth profiling techniques. From secondary ion mass spectrometry (SIMS) measurements no carbon from CO{sub 2} is detected in the silica while it is found in Si. These results suggest that CO{sub 2} diffuses through the silica. Exchanges of oxygen between CO{sub 2} and silica can be observed from {sup 18}O to {sup 16}O SIMS signals variation. The oxygen concentration depth profiles were determined quantitatively using the narrow resonance near 151 keV in the {sup 18}O(p,α){sup 15}N nuclear reaction (Narrow Resonance Profiling, NRP). We demonstrate that two distinct oxygen exchanges processes co-exist and we determine the diffusion coefficient of the CO{sub 2} molecule in the silica at 1100 °C.

  19. Depth profile measurement with lenslet images of the plenoptic camera

    Science.gov (United States)

    Yang, Peng; Wang, Zhaomin; Zhang, Wei; Zhao, Hongying; Qu, Weijuan; Zhao, Haimeng; Asundi, Anand; Yan, Lei

    2018-03-01

    An approach for carrying out depth profile measurement of an object with the plenoptic camera is proposed. A single plenoptic image consists of multiple lenslet images. To begin with, these images are processed directly with a refocusing technique to obtain the depth map, which does not need to align and decode the plenoptic image. Then, a linear depth calibration is applied based on the optical structure of the plenoptic camera for depth profile reconstruction. One significant improvement of the proposed method concerns the resolution of the depth map. Unlike the traditional method, our resolution is not limited by the number of microlenses inside the camera, and the depth map can be globally optimized. We validated the method with experiments on depth map reconstruction, depth calibration, and depth profile measurement, with the results indicating that the proposed approach is both efficient and accurate.

  20. A new method for depth profiling

    International Nuclear Information System (INIS)

    Chittleborough, C.W.; Chaudhri, M.A.; Rouse, J.L.

    1978-01-01

    A simple method for obtaining depth profiles of concentrations has been developed for charged particle induced nuclear reactions which produce γ-rays or neutrons. This method is particularly suitable for non-resonant reactions but is also applicable to resonant reactions and can examine the concentration of the sought nuclide throughout the entire activation depth of the incoming particles in the matrix

  1. SIMS depth profile analysis of environmental microparticles

    International Nuclear Information System (INIS)

    Konarski, P.

    2000-01-01

    Environmental and technological research demands chemical characterization of aerosol particles so minute in size, that conventional methods for bulk analyses are simply not applicable. In this work novel application of secondary ion mass spectrometry (SIMS) for characterization of microparticles suspended in atmosphere of the working environment of glass plant Thomson Polkolor, Piaseczno and steelworks Huta Sendzimira, Cracow is presented. The new technique based on sample rotation in depth profile analysis of sub-micrometer particulate material was performed on SAJW-02 analyser equipped with Balzers 16 mm quadrupole spectrometer and sample rotation manipulator using 5 keV Ar + and O 2 + ion beams. The results were compared with the standard method used on ims-3f Cameca analyser 12 keV O 2 + ion beam. Grain size distributions of aerosol microparticles were estimated using eight-stage cascade impactor with particle size range of 0.2 μm to 15 μm. Elemental concentration and crystalline structure of the collected dust particles were performed using spark source mass spectrometry and X-ray diffraction methods. SIMS depth profile analysis shows that sub-micrometer particles do not have uniform morphology, The core-shell structure has been observed for particles collected in both factories. Presented models show that the steelworks particles consists mainly of iron and manganese cores. At the shells of these microparticles :lead, chlorine and fluorine are found. The cores of glass plant submicrometer particles consists mainly of lead-zirconium glass covered by a shell containing carbon and copper. Sample rotation technique applied SIMS appears to be an effective tool for environmental microparticle morphology studies. (author)

  2. Potentials and pitfalls of depth profile (10Be), burial isochron (26Al/10Be) and palaeomagnetic techniques for dating Early Pleistocene terrace deposits of the Moselle valley (Germany)

    Science.gov (United States)

    Rixhon, Gilles; Cordier, Stéphane; May, Simon Matthias; Kelterbaum, Daniel; Szemkus, Nina; Keulertz, Rebecca; Dunai, Tibor; Binnie, Steven; Hambach, Ulrich; Scheidt, Stephanie; Brueckner, Helmut

    2016-04-01

    Throughout the river network of the Rhenish Massif the so-called main terraces complex (MTC) forms the morphological transition between a wide upper palaeovalley and a deeply incised lower valley. The youngest level of this complex (YMT), directly located at the edge of the incised valley, represents a dominant geomorphic feature; it is often used as a reference level to identify the beginning of the main middle Pleistocene incision episode (Demoulin & Hallot, 2009). Although the main terraces are particularly well preserved in the lower Moselle valley, a questionable age of ca. 800 ka is assumed for the YMT, mainly based on the uncertain extrapolation of controversially interpreted palaeomagnetic data obtained in the Rhine valley. In this study, we applied terrestrial cosmogenic nuclide (TCN) dating (10Be/26Al) and palaeomagnetic dating to Moselle fluvial sediments of the MTC. To unravel the spatio-temporal characteristics of the Pleistocene evolution of the valley, several sites along the lower Moselle were sampled following two distinct TCN dating strategies: depth profiles where the original terrace (palaeo-) surface is well preserved and did not experience a major post-depositional burial (e.g., loess cover); and the isochron technique, where the sediment thickness exceeds 4.5-5 m. One terrace deposit was sampled for both approaches (reference site). In addition, palaeomagnetic sampling was systematically performed in each terrace sampled for TCN measurements. The TCN dating techniques show contrasting results for our reference site. Three main issues are observed for the depth profile method: (i) an inability of the modeled profile to constrain the 10Be concentration of the uppermost sample; (ii) an overestimated density value as model output; and (iii) a probable concentration steady state of the terrace deposits. By contrast, the isochron method yields a burial age estimate of 1.26 +0.29/-0.25 Ma, although one sample showed a depleted 26Al/10Be ratio

  3. Development and Applications of Time of Flight Neutron Depth Profiling

    International Nuclear Information System (INIS)

    Cady, Bingham; Unlu, Kenan

    2005-01-01

    The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. For example, the subtle differences in spatial distribution and composition of many chemical species in the near surface region and across interfacial boundaries can significantly alter the electronic and optical properties of materials. A number of analytical techniques for depth profiling have been developed during the last two decades. neutron Depth Profiling (NDP) is one of the leading analytical techniques. The NDP is a nondestructive near surface technique that utilizes thermal/cold neutron beam to measure the concentration of specific light elements versus their depth in materials. The depth is obtained from the energy loss of protons, alphas or recoil atoms in substrate materials. Since the charged particle energy determination using surface barrier detector is used for NDP, the depth resolution is highly dependent on the detectors an d detection instruments. The depth resolutions of a few tens of nm are achieved with available NDP facilities in the world. However, the performance of NDP needs to be improved in order to obtain a few A depth resolutions

  4. Photodegradation of wood and depth profile analysis

    International Nuclear Information System (INIS)

    Kataoka, Y.

    2008-01-01

    Photochemical degradation is a key process of the weathering that occurs when wood is exposed outdoors. It is also a major cause of the discoloration of wood in indoor applications. The effects of sunlight on the chemical composition of wood are superficial in nature, but estimates of the depth at which photodegradation occurs in wood vary greatly from 80 microm to as much as 2540 mic rom. Better understanding of the photodegradation of wood through depth profile analysis is desirable because it would allow the development of more effective photo-protective treatments that target the surface layers of wood most susceptible to photodegradation. This paper briefly describes fundamental aspects of photodegradation of wood and reviews progress made in the field of depth profile study on the photodegradation of wood. (author)

  5. Development of Cold Neutron Depth Profiling System at HANARO

    International Nuclear Information System (INIS)

    Park, B. G.; Choi, H. D.; Sun, G. M.

    2012-01-01

    The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. A number of analytical techniques for depth profiling have been developed. Neutron Depth Profiling (NDP) system which was developed by Ziegler et al. is one of the leading analytical techniques. In NDP, a thermal or cold neutron beam passes through a material and interacts with certain isotopes that are known to emit monoenergetic-charged particle remaining a recoil nucleus after neutron absorption. The depth is obtained from the energy loss of those charged particles escaping surface of substrate material. For various applications of NDP technique, the Cold Neutron Depth Profiling System (CN-NDP) was developed at a neutron guide CG1 installed at the HANARO cold neutron source. In this study the design features of the cold neutron beam and target chamber for the CN-NDP system are given. Also, some experiments for the performance tests of the CN-NDP system are described

  6. Depth profiling of tritium by neutron time-of-flight

    International Nuclear Information System (INIS)

    Davis, J.C.; Anderson, J.D.; Lefevre, H.W.

    1976-01-01

    A method to measure the depth profile of tritium implanted or absorbed in materials was developed. The sample to be analyzed is bombarded with a pulsed proton beam and the energy of neutrons produced by the T(p,n) reaction is measured by the time-of-flight technique. From the neutron energy the depth in the target of the T atoms may be inferred. A sensitivity of 0.1 at. percent T or greater is possible. The technique is non-destructive and may be used with thick or radioactive host materials. Samples up to 20 μm in thickness may be profiled with resolution limited by straggling of the proton beam for depths greater than 1 μm. Deuterium depth profiling has been demonstrated using the D(d,n) reaction. The technique has been used to observe the behavior of an implantation spike of T produced by a 400 keV T + beam stopping at a depth of 3 μm in 11 μm thick layers of Ti and TiH. The presence of H in the Ti lattice is observed to inhibit the diffusion of T through the lattice. Effects of the total hydrogen concentration (H + T) being forced above stochiometry at the implantation site are suggested by the shapes of the implantation spikes

  7. Ion induced optical emission for surface and depth profile analysis

    International Nuclear Information System (INIS)

    White, C.W.

    1977-01-01

    Low-energy ion bombardment of solid surfaces results in the emission of infrared, visible, and ultraviolet radiation produced by inelastic ion-solid collision processes. The emitted optical radiation provides important insight into low-energy particle-solid interactions and provides the basis for an analysis technique which can be used for surface and depth profile analysis with high sensitivity. The different kinds of collision induced optical radiation emitted as a result of low-energy particle-solid collisions are reviewed. Line radiation arising from excited states of sputtered atoms or molecules is shown to provide the basis for surface and depth profile analysis. The spectral characteristics of this type of radiation are discussed and applications of the ion induced optical emission technique are presented. These applications include measurements of ion implant profiles, detection sensitivities for submonolayer quantities of impurities on elemental surfaces, and the detection of elemental impurities on complex organic substrates

  8. Element depth profiles of porous silicon

    International Nuclear Information System (INIS)

    Kobzev, A.P.; Nikonov, O.A.; Kulik, M.; Zuk, J.; Krzyzanowska, H.; Ochalski, T.J.

    1997-01-01

    Element depth profiles of porous silicon were measured on the Van-de-Graaff accelerator in the energy range of 4 He + ions from 2 to 3.2 MeV. Application of complementary RBS, ERD and 16 O(α,α) 16 O nuclear reaction methods permits us to obtain: 1) the exact silicon, oxygen and hydrogen distribution in the samples, 2) the distribution of partial pore concentrations. The oxygen concentration in porous silicon reaches 30%, which allows one to assume the presence of silicon oxide in the pores and to explain the spectrum shift of luminescence into the blue area

  9. Hydrogen in oxygen-free, phosphorus-doped copper - Charging techniques, hydrogen contents and modelling of hydrogen diffusion and depth profile

    Energy Technology Data Exchange (ETDEWEB)

    Martinsson, Aasa [Swerea KIMAB, Kista (Sweden); Sandstroem, Rolf [Swerea KIMAB, Kista (Sweden); Div. of Materials Science and Engineering, KTH Royal Institute of Technology, Stockholm (Sweden); Lilja, Christina [Swedish Nuclear Fuel and Waste Management Co., Stockholm (Sweden)

    2013-01-15

    In Sweden spent nuclear fuel is planned to be disposed of by encapsulating in cast iron inserts protected by a copper shell. The copper can be exposed to hydrogen released during corrosion processes in the inserts. If the hydrogen is taken up by the copper, it could lead to hydrogen embrittlement. Specimens from oxygen-free copper have been hydrogen charged using two different methods. The purpose was to investigate how hydrogen could be introduced into copper in a controlled way. The thermal charging method resulted in a reduction of the initial hydrogen content. After electrochemical charging of cylindrical specimens, the measured hydrogen content was 2.6 wt. ppm which should compared with 0.6 wt. ppm before charging. The retained hydrogen after two weeks was reduced by nearly 40%. Recently the paper 'Hydrogen depth profile in phosphorus-doped, oxygen-free copper after cathodic charging' (Martinsson and Sandstrom, 2012) has been published. The paper describes experimental results for bulk specimens as well as presenting a model. Almost all the hydrogen is found to be located less than 100 {mu}m from the surface. This model is used to interpret the experimental results on foils in the present report. Since the model is fully based on fundamental equations, it can be used to analyse what happens in new situations. In this report the effect of the charging intensity, the grain size, the critical nucleus size for hydrogen bubble formation as well as the charging time are analysed.

  10. Hydrogen in oxygen-free, phosphorus-doped copper-Charging techniques, hydrogen contents and modelling of hydrogen diffusion and depth profile

    International Nuclear Information System (INIS)

    Martinsson, Aasa; Sandstroem, Rolf; Lilja, Christina

    2013-01-01

    In Sweden spent nuclear fuel is planned to be disposed of by encapsulating in cast iron inserts protected by a copper shell. The copper can be exposed to hydrogen released during corrosion processes in the inserts. If the hydrogen is taken up by the copper, it could lead to hydrogen embrittlement. Specimens from oxygen-free copper have been hydrogen charged using two different methods. The purpose was to investigate how hydrogen could be introduced into copper in a controlled way. The thermal charging method resulted in a reduction of the initial hydrogen content. After electrochemical charging of cylindrical specimens, the measured hydrogen content was 2.6 wt. ppm which should compared with 0.6 wt. ppm before charging. The retained hydrogen after two weeks was reduced by nearly 40%. Recently the paper 'Hydrogen depth profile in phosphorus-doped, oxygen-free copper after cathodic charging' (Martinsson and Sandstrom, 2012) has been published. The paper describes experimental results for bulk specimens as well as presenting a model. Almost all the hydrogen is found to be located less than 100 μm from the surface. This model is used to interpret the experimental results on foils in the present report. Since the model is fully based on fundamental equations, it can be used to analyse what happens in new situations. In this report the effect of the charging intensity, the grain size, the critical nucleus size for hydrogen bubble formation as well as the charging time are analysed

  11. A new method for depth profiling reconstruction in confocal microscopy

    Science.gov (United States)

    Esposito, Rosario; Scherillo, Giuseppe; Mensitieri, Giuseppe

    2018-05-01

    Confocal microscopy is commonly used to reconstruct depth profiles of chemical species in multicomponent systems and to image nuclear and cellular details in human tissues via image intensity measurements of optical sections. However, the performance of this technique is reduced by inherent effects related to wave diffraction phenomena, refractive index mismatch and finite beam spot size. All these effects distort the optical wave and cause an image to be captured of a small volume around the desired illuminated focal point within the specimen rather than an image of the focal point itself. The size of this small volume increases with depth, thus causing a further loss of resolution and distortion of the profile. Recently, we proposed a theoretical model that accounts for the above wave distortion and allows for a correct reconstruction of the depth profiles for homogeneous samples. In this paper, this theoretical approach has been adapted for describing the profiles measured from non-homogeneous distributions of emitters inside the investigated samples. The intensity image is built by summing the intensities collected from each of the emitters planes belonging to the illuminated volume, weighed by the emitters concentration. The true distribution of the emitters concentration is recovered by a new approach that implements this theoretical model in a numerical algorithm based on the Maximum Entropy Method. Comparisons with experimental data and numerical simulations show that this new approach is able to recover the real unknown concentration distribution from experimental profiles with an accuracy better than 3%.

  12. Metrology aspects of SIMS depth profiling for advanced ULSI processes

    International Nuclear Information System (INIS)

    Budrevich, Andre; Hunter, Jerry

    1998-01-01

    As the semiconductor industry roadmap passes through the 0.1 μm technology node, the junction depth of the transistor source/drain extension will be required to be less than 20 nm and the well doping will be near 1.0 μm in depth. The development of advanced ULSI processing techniques requires the evolution of new metrology tools to ensure process capability. High sensitivity (ppb) coupled with excellent depth resolution (1 nm) makes SIMS the technique of choice for measuring the in-depth chemical distribution of these dopants with high precision and accuracy. This paper will discuss the issues, which impact the accuracy and precision of SIMS measurements of ion implants (both shallow and deep). First this paper will discuss common uses of the SIMS technique in the technology development and manufacturing of advanced ULSI processes. In the second part of this paper the ability of SIMS to make high precision measurements of ion implant depth profiles will be studied

  13. Chemometric characterization of soil depth profiles

    International Nuclear Information System (INIS)

    Krieg, M.; Einax, J.

    1994-01-01

    The application of multivariate-statistical methods to the description of the metal distribution in soil depth profiles is shown. By means of cluster analysis, it is possible to get a first overview of the main differences in the metal status of the soil horizons. In case of anthropogenic soil pollution or geogenic enrichment, cluster analysis was able to detect the extent of the polluted soil layer or the different geological layers. The results of cluster analysis can be confirmed by means of multidimensional variance and discriminant analysis. Methods of discriminant analysis can also be used as a tool to determine the optimum number of variables which has to be measured for the classification of unknown soil samples into different pollution levels. Factor analysis yields an identification of not directly observable relationships between the variables. With additional knowledge about the orographic situation of the area and the probable sources of emission the factor loadings give information on the immission structure at the sampling location. (orig.)

  14. Depth profile and interface analysis in the nm-range

    International Nuclear Information System (INIS)

    Oswald, S.; Reiche, R.; Zier, M.; Baunack, S.; Wetzig, K.

    2005-01-01

    In modern technology, thin films are shrinking more and more to a thickness of few nanometers. Analytical investigations of such thin films using the traditional sputter depth profiling, sputtering in combination with surface-analytical techniques, have limitations due to physical effects especially for very thin films. These limitations are pointed out and some alternatives are discussed. Non-destructive analysis with angle-resolved X-ray photoelectron spectroscopy is demonstrated to be a useful method for such investigations. Both qualitative and quantitative results can be obtained even for complex layer structures. Nevertheless, there are also limitations of this method and some alternatives or complementary methods are considered

  15. A dosimetry system for fast measurement of 3D depth-dose profiles in charged-particle tumor therapy with scanning techniques

    International Nuclear Information System (INIS)

    Brusasco, C.; Voss, B.; Schardt, D.; Kraemer, M.; Kraft, G.

    2000-01-01

    The high complexity and high instantaneous dose rates of the intensity modulated treatment plans performed using carbon beams at GSI require a good granularity of the dose verification procedures. As a consequence, a new detector system was developed in order to obtain a 3D reconstruction of the relative depth-dose distributions in a short time, with high granularity and over large volumes. The system takes advantage of the active beam delivery system operative in the therapy facility of GSI and consists of one position sensitive detector with a stack of ionization chambers and a range-shifter. After a technical description of the apparatus, the procedure to reconstruct the 3D measurements is explained and the possible sources of errors in the measurements are analyzed. Finally, the results of the measurement of some treatment plans are shown

  16. Ion beam techniques for the analysis of light elements in thin films, including depth profiling. Final report of a co-ordinated research project 2000-2003

    International Nuclear Information System (INIS)

    2004-10-01

    This publication highlights the achievements of a Coordinated Research Project (CRP) to promote the potential of accelerator-based nuclear techniques of analysis for light elements in thin films. The objectives of this CRP were to develop a coordinated research effort between accelerator laboratories and materials science research groups in order to assist and promote the development of quality assurance methods, to evaluate databases of parameters needed for quantitative analysis, and to develop and apply techniques to selected problems concerning the surface modification of materials and production of thin films. Through various case studies, this publication assesses and demonstrates the effectiveness of accelerator-based nuclear techniques for analysis to provide valuable data and knowledge not readily accessible using other methods

  17. Wind profiler mixing depth and entrainment measurements with chemical applications

    Energy Technology Data Exchange (ETDEWEB)

    Angevine, W.M.; Trainer, M.; Parrish, D.D.; Buhr, M.P.; Fehsenfeld, F.C. [NOAA Aeronomy Lab., Boulder, CO (United States); Kok, G.L. [NCAR Research Aviation Facility, Boulder, CO (United States)

    1994-12-31

    Wind profiling radars operating at 915 MHz have been present at a number of regional air quality studies. The profilers can provide a continuous, accurate record of the depth of the convective mixed layer with good time resolution. Profilers also provide information about entrainment at the boundary layer top. Mixing depth data from several days of the Rural Oxidants in the Southern Environment II (ROSE II) study in Alabama in June, 1992 are presented. For several cases, chemical measurements from aircraft and ground-based instruments are shown to correspond to mixing depth and entrainment zone behavior observed by the profiler.

  18. Pulsed photothermal depth profiling of tattoos undergoing laser removal treatment

    Science.gov (United States)

    Milanic, Matija; Majaron, Boris

    2012-02-01

    Pulsed photothermal radiometry (PPTR) allows noninvasive determination of temperature depth profiles induced by pulsed laser irradiation of strongly scattering biological tissues and organs, including human skin. In present study, we evaluate the potential of this technique for investigational characterization and possibly quantitative evaluation of laser tattoo removal. The study involved 5 healthy volunteers (3 males, 2 females), age 20-30 years, undergoing tattoo removal treatment using a Q-switched Nd:YAG laser. There were four measurement and treatment sessions in total, separated by 2-3 months. Prior to each treatment, PPTR measurements were performed on several tattoo sites and one nearby healthy site in each patient, using a 5 ms Nd:YAG laser at low radiant exposure values and a dedicated radiometric setup. The laser-induced temperature profiles were then reconstructed by applying a custom numerical code. In addition, each tatoo site was documented with a digital camera and measured with a custom colorimetric system (in tristimulus color space), providing an objective evaluation of the therapeutic efficacy to be correlated with our PPTR results. The results show that the laser-induced temperature profile in untreated tattoos is invariably located at a subsurface depth of 300 μm. In tattoo sites that responded well to laser therapy, a significant drop of the temperature peak was observed in the profiles obtained from PPTR record. In several sites that appeared less responsive, as evidenced by colorimetric data, a progressive shift of the temperature profile deeper into the dermis was observed over the course of consecutive laser treatments, indicating that the laser tattoo removal was efficient.

  19. Depth resolution and preferential sputtering in depth profiling of sharp interfaces

    International Nuclear Information System (INIS)

    Hofmann, S.; Han, Y.S.; Wang, J.Y.

    2017-01-01

    Highlights: • Interfacial depth resolution from MRI model depends on sputtering rate differences. • Depth resolution critically depends on the dominance of roughness or atomic mixing. • True (depth scale) and apparent (time scale) depth resolutions are different. • Average sputtering rate approximately yields true from apparent depth resolution. • Profiles by SIMS and XPS are different but similar to surface concentrations. - Abstract: The influence of preferential sputtering on depth resolution of sputter depth profiles is studied for different sputtering rates of the two components at an A/B interface. Surface concentration and intensity depth profiles on both the sputtering time scale (as measured) and the depth scale are obtained by calculations with an extended Mixing-Roughness-Information depth (MRI)-model. The results show a clear difference for the two extreme cases (a) preponderant roughness and (b) preponderant atomic mixing. In case (a), the interface width on the time scale (Δt(16–84%)) increases with preferential sputtering if the faster sputtering component is on top of the slower sputtering component, but the true resolution on the depth scale (Δz(16–84%)) stays constant. In case (b), the interface width on the time scale stays constant but the true resolution on the depth scale varies with preferential sputtering. For similar order of magnitude of the atomic mixing and the roughness parameters, a transition state between the two extremes is obtained. While the normalized intensity profile of SIMS represents that of the surface concentration, an additional broadening effect is encountered in XPS or AES by the influence of the mean electron escape depth which may even cause an additional matrix effect at the interface.

  20. Depth resolution and preferential sputtering in depth profiling of sharp interfaces

    Energy Technology Data Exchange (ETDEWEB)

    Hofmann, S. [Max Planck Institute for Intelligent Systems (formerly MPI for Metals Research), Heisenbergstrasse 3, D-70569 Stuttgart (Germany); Han, Y.S. [Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063 Guangdong (China); Wang, J.Y., E-mail: wangjy@stu.edu.cn [Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063 Guangdong (China)

    2017-07-15

    Highlights: • Interfacial depth resolution from MRI model depends on sputtering rate differences. • Depth resolution critically depends on the dominance of roughness or atomic mixing. • True (depth scale) and apparent (time scale) depth resolutions are different. • Average sputtering rate approximately yields true from apparent depth resolution. • Profiles by SIMS and XPS are different but similar to surface concentrations. - Abstract: The influence of preferential sputtering on depth resolution of sputter depth profiles is studied for different sputtering rates of the two components at an A/B interface. Surface concentration and intensity depth profiles on both the sputtering time scale (as measured) and the depth scale are obtained by calculations with an extended Mixing-Roughness-Information depth (MRI)-model. The results show a clear difference for the two extreme cases (a) preponderant roughness and (b) preponderant atomic mixing. In case (a), the interface width on the time scale (Δt(16–84%)) increases with preferential sputtering if the faster sputtering component is on top of the slower sputtering component, but the true resolution on the depth scale (Δz(16–84%)) stays constant. In case (b), the interface width on the time scale stays constant but the true resolution on the depth scale varies with preferential sputtering. For similar order of magnitude of the atomic mixing and the roughness parameters, a transition state between the two extremes is obtained. While the normalized intensity profile of SIMS represents that of the surface concentration, an additional broadening effect is encountered in XPS or AES by the influence of the mean electron escape depth which may even cause an additional matrix effect at the interface.

  1. A small and compact AMS facility for tritium depth profiling

    Indian Academy of Sciences (India)

    employing diamond-like carbon (DLC) stripper foils at this accelerator, another ... the switching magnet the tritium ions are counted with a surface barrier detector. .... AMS has been successfully applied to depth profiling of tritium in graphite ...

  2. Narrow nuclear resonance profiling of Al with subnanometric depth resolution

    International Nuclear Information System (INIS)

    Rosa, E.B.O. da; Krug, C.; Stedile, F.C.; Morais, J.; Baumvol, I.J.R.

    2002-01-01

    We report on the use of the narrow and isolated resonance at 404.9 keV in the cross-section curve of the 27 Al(p,γ) 28 Si nuclear reaction for profiling Al in ultrathin aluminum oxide films on Si. The samples were characterized as-deposited and after thermal annealing, so that Al transport could be studied. An estimated depth resolution of approximately 0.4 nm near the surface of the films could be obtained owing to: (i) the very small resonance width; (ii) the high stopping power of Al 2 O 3 for 404.9 keV protons; (iii) the high energy stability of the proton beam provided by the 500 kV HVEE ion implanter at Porto Alegre; and (iv) an apparent thickness magnification by a factor between 2.0 and 2.4 with the use of glancing incidence. This technique is compared to other methods for Al profiling like medium energy ion scattering and some sputtering-based techniques

  3. SIMS depth profiling of working environment nanoparticles

    Science.gov (United States)

    Konarski, P.; Iwanejko, I.; Mierzejewska, A.

    2003-01-01

    Morphology of working environment nanoparticles was analyzed using sample rotation technique in secondary ion mass spectrometry (SIMS). The particles were collected with nine-stage vacuum impactor during gas tungsten arc welding (GTAW) process of stainless steel and shielded metal arc welding (SMAW) of mild steel. Ion erosion of 300-400 nm diameter nanoparticles attached to indium substrate was performed with 2 keV, 100 μm diameter, Ar + ion beam at 45° ion incidence and 1 rpm sample rotation. The results show that both types of particles have core-shell morphology. A layer of fluorine, chlorine and carbon containing compounds covers stainless steel welding fume particles. The cores of these particles are enriched in iron, manganese and chromium. Outer shell of mild steel welding fume particles is enriched in carbon, potassium, chlorine and fluorine, while the deeper layers of these nanoparticles are richer in main steel components.

  4. SIMS depth profiling of working environment nanoparticles

    Energy Technology Data Exchange (ETDEWEB)

    Konarski, P.; Iwanejko, I.; Mierzejewska, A

    2003-01-15

    Morphology of working environment nanoparticles was analyzed using sample rotation technique in secondary ion mass spectrometry (SIMS). The particles were collected with nine-stage vacuum impactor during gas tungsten arc welding (GTAW) process of stainless steel and shielded metal arc welding (SMAW) of mild steel. Ion erosion of 300-400 nm diameter nanoparticles attached to indium substrate was performed with 2 keV, 100 {mu}m diameter, Ar{sup +} ion beam at 45 deg. ion incidence and 1 rpm sample rotation. The results show that both types of particles have core-shell morphology. A layer of fluorine, chlorine and carbon containing compounds covers stainless steel welding fume particles. The cores of these particles are enriched in iron, manganese and chromium. Outer shell of mild steel welding fume particles is enriched in carbon, potassium, chlorine and fluorine, while the deeper layers of these nanoparticles are richer in main steel components.

  5. Design and construction of the facility for neutron depth profiling in research reactor RECH-1

    International Nuclear Information System (INIS)

    Mutis P, Octavio; Navarro A, Gustavo; Henriquez A, Carlos; Pereda B, Claudio

    2002-01-01

    Here is described the experimental facility for Neutron Depth Profiling, NDP, constructed at the CCHEN laboratories, as well as some general aspects of the technique. It is also shown applications to the concentration analysis of 10 B and 6 Li as a function of depth for borophosphosilicate glass, BPSG, and for a thick sinter of 6 Li in a zinc-nickel-manganese oxide. Achieved depth resolution is comparable to that obtained in reference advanced laboratories. (author)

  6. Depth profile analysis of polymerized fluorine compound on photo-resist film with angle-resolved XPS

    International Nuclear Information System (INIS)

    Iijima, Yoshitoki; Kubota, Toshio; Oinaka, Syuhei

    2013-01-01

    Angle-resolved XPS (ARXPS) is an observation technique which is very effective in chemical depth analysis method less than photoelectron detected depth. For the analysis of depth profile, several analysis methods have been proposed to calculate the depth profile using the ARXPS method. The present report is the measurements of depth profile of the fluorine in a fluorine-containing photo-resist film using the ARXPS method and the depth profile of concentration have been successfully determined using the ARCtick 1.0 software. It has been observed that thickness of the fluorocarbon enriched surface layer of the photo-resist was 2.7 nm, and so that the convert of the ARXPS data from the angle profile to the depth profile was proved to be useful analysis method for the ultrathin layer depth. (author)

  7. Fluence dependence of disorder depth profiles in Pb implanted Si

    International Nuclear Information System (INIS)

    Christodoulides, C.E.; Kadhim, N.J.; Carter, G.

    1980-01-01

    The total, depth integrated disorder, induced by Pb implantation into Si at room temperature, initially increases rapidly with implantation fluence and then reaches a quasi saturation level where the increase with fluence is slow. Measurements of the depth distributions of the disorder, using high resolution low angle exit Rutherford Backscattering/Channelling analysis, suggest that the quasi saturation results from overlapping of disordered zones generated deep in the tail of the disorder-depth profiles. The depth of the disordered solid-crystal boundary, xsub(D), increases with ion fluence PHI, according to the relation xsub(D) = x bar + f(PHI).σ, where x bar is the most probable projected depth and σ the projected standard deviation of disorder generation. It is shown that this relationship is consistent with an approximately Gaussian depth distribution of disorder production. (author)

  8. An optical fiber expendable seawater temperature/depth profile sensor

    Science.gov (United States)

    Zhao, Qiang; Chen, Shizhe; Zhang, Keke; Yan, Xingkui; Yang, Xianglong; Bai, Xuejiao; Liu, Shixuan

    2017-10-01

    Marine expendable temperature/depth profiler (XBT) is a disposable measuring instrument which can obtain temperature/depth profile data quickly in large area waters and mainly used for marine surveys, scientific research, military application. The temperature measuring device is a thermistor in the conventional XBT probe (CXBT)and the depth data is only a calculated value by speed and time depth calculation formula which is not an accurate measurement result. Firstly, an optical fiber expendable temperature/depth sensor based on the FBG-LPG cascaded structure is proposed to solve the problems of the CXBT, namely the use of LPG and FBG were used to detect the water temperature and depth, respectively. Secondly, the fiber end reflective mirror is used to simplify optical cascade structure and optimize the system performance. Finally, the optical path is designed and optimized using the reflective optical fiber end mirror. The experimental results show that the sensitivity of temperature and depth sensing based on FBG-LPG cascade structure is about 0.0030C and 0.1%F.S. respectively, which can meet the requirements of the sea water temperature/depth observation. The reflectivity of reflection mirror is in the range from 48.8% to 72.5%, the resonant peak of FBG and LPG are reasonable and the whole spectrum are suitable for demodulation. Through research on the optical fiber XBT (FXBT), the direct measurement of deep-sea temperature/depth profile data can be obtained simultaneously, quickly and accurately. The FXBT is a new all-optical seawater temperature/depth sensor, which has important academic value and broad application prospect and is expected to replace the CXBT in the future.

  9. Photothermal depth profiling for multilayered Structures by particle swarm optimization

    International Nuclear Information System (INIS)

    Chen, Z J; Fang, J W; Zhang, S Y

    2011-01-01

    This paper presents a method to reconstruct thermal conductivity depth profile of a layered medium using noisy photothermal data. The method tries to obtain an accurate reconstruction of discontinuous profile using particle swarm optimization (PSO) algorithm and total variation (TV) regularization. The reconstructions of different thermal conductivity profiles have been tested on simulated photothermal data. The simulation results show that the method can find accurately the locations of discontinuities, and the reconstructed profiles are in agreement with the original ones. Moreover, the results also show the method has good robustness and anti-noise capability.

  10. Secondary neutral mass spectrometry depth profile analysis of silicides

    International Nuclear Information System (INIS)

    Beckmann, P.; Kopnarski, M.; Oechsner, H.

    1985-01-01

    The Direct Bombardment Mode (DBM) of Secondary Neutral Mass Spectrometry (SNMS) has been applied for depth profile analysis of two different multilayer systems containing metal silicides. Due to the extremely high depth resolution obtained with low energy SNMS structural details down to only a few atomic distances are detected. Stoichiometric information on internal oxides and implanted material is supplied by the high quantificability of SNMS. (Author)

  11. PIXE depth profiling using variation of detection angle

    International Nuclear Information System (INIS)

    Miranda, J.; Rickards, J.; Trejo-Luna, R.

    2006-01-01

    A method to apply particle induced X-ray emission (PIXE) for depth profiling, based on the variation of the X-ray detection angle, is proposed. The procedure uses X-ray yields normalized to those emitted at a particular reference angle. Application of the method to implanted samples and thin metallic films gave excellent results regarding the range of implanted ions and film thickness, respectively. However, there is no complete information about the width of the distribution of the implanted ions, emphasizing the need to develop a full mathematical algorithm to obtain the general depth profile

  12. Depth-profiling using X-ray photoelectron spectroscopy

    International Nuclear Information System (INIS)

    Pijolat, M.; Hollinger, G.

    1980-12-01

    The possibilities of X-ray photoelectron spectroscopy (or ESCA) for depth-profiling into shallow depths (approximately 10-100 A) have been studied. The method of ion-sputtering removal has first been investigated in order to improve its depth-resolution (approximately 50-150 A). A procedure which eliminates the effects due to the resolution function of the instrumental probe (analysed depth approximately 50 A) has been settled; but it is not yet sufficient, and the sputter - broadening due to the ion-induced damages must be taken into account (broadening function approximately 50 A for approximately 150 A removal). Because of serious difficulties in estimating the broadening function an alternative is to develop non destructive methods, so a new method based on the dependence of the analysed depth with the electron emission angle is presented. The extraction of the concentration profile from angular distribution experiments is achieved, in the framework of a flat-layer model, by minimizing the difference between theoretical and experimental relative intensities. The applicability and limitations of the method are discussed on the basis of computer simulation results. The depth probed is of the order of 3 lambda (lambda being the value of the inelastic mean free path, typically 10-20 A) and the depth-resolution is of the order of lambda/3 [fr

  13. Interpreting Repeated Temperature-Depth Profiles for Groundwater Flow

    NARCIS (Netherlands)

    Bense, Victor F.; Kurylyk, Barret L.; Daal, van Jonathan; Ploeg, van der Martine J.; Carey, Sean K.

    2017-01-01

    Temperature can be used to trace groundwater flows due to thermal disturbances of subsurface advection. Prior hydrogeological studies that have used temperature-depth profiles to estimate vertical groundwater fluxes have either ignored the influence of climate change by employing steady-state

  14. Nondestructive investigatons of the depth profile of PZT ferroelectric films

    Czech Academy of Sciences Publication Activity Database

    Deineka, Alexander; Glinchuk, M. D.; Jastrabík, Lubomír; Suchaneck, G.; Gerlach, G.

    2001-01-01

    Roč. 264, - (2001), s. 151-156 ISSN 0015-0193 R&D Projects: GA MŠk LN00A015; GA ČR GA202/00/1425 Institutional research plan: CEZ:AV0Z1010914 Keywords : ferroelectric film * depth profile * interface Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 0.471, year: 2001

  15. Pulsed glow discharge mass spectrometry for molecular depth profiling of polymers

    International Nuclear Information System (INIS)

    Lobo, L.; Pereiro, R.; Sanz-Medel, A.; Bordel, N.; Pisonero, J.; Licciardello, A.; Tuccitto, N.; Tempez, A.; Chapon, P.

    2009-01-01

    Full text: Nowadays thin films of polymeric materials involve a wide range of industrial applications, so techniques capable of providing in-depth profile information are required. Most of the techniques available for this purpose are based on the use of energetic particle beams which interact with polymers producing undesirable physicochemical modifications. Radiofrequency pulsed glow discharge (rf-pulsed-GD) coupled to time-of-flight mass spectrometry (TOFMS) could afford the possibility of acquiring both elemental and molecular information creating minimal damage to surfaces and thereby obtaining depth profiles. This work will evaluate rf-GDs coupled to an orthogonal TOFMS for direct analysis of polymers. (author)

  16. Tritium depth profiling in carbon by accelerator mass spectrometry

    International Nuclear Information System (INIS)

    Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.; Bekris, N.; Penzhorn, R.-D.

    2000-01-01

    Tritium depth profiling measurements by accelerator mass spectrometry have been performed at the facility installed at the Rossendorf 3 MV Tandetron. In order to achieve a uniform erosion at the target surface inside a commercial Cs ion sputtering source and to avoid edge effects, the samples were mechanically scanned and the signals were recorded only during sputtering at the centre of the sputtered area. The sputtered negative ions were mass analysed by the injection magnet of the Tandetron. Hydrogen and deuterium profiles were measured with the Faraday cup between the injection magnet and the accelerator, while the tritium was counted after the accelerator with semiconductor detectors. Depth profiles have been measured for carbon samples which had been exposed to the plasma at the first wall of the Garching fusion experiment ASDEX-Upgrade and from the European fusion experiment JET, Culham, UK

  17. Molecular depth profiling of organic and biological materials

    Energy Technology Data Exchange (ETDEWEB)

    Fletcher, John S. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom)]. E-mail: John.Fletcher@manchester.ac.uk; Conlan, Xavier A. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom); Lockyer, Nicholas P. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom); Vickerman, John C. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom)

    2006-07-30

    Atomic depth profiling using secondary ion mass spectrometry, SIMS, is common in the field micro-electronics; however, the generation of molecular information as a function of sample depth is difficult due to the accumulation of damage both on and beneath the sample surface. The introduction of polyatomic ion beams such as SF{sub 5} and C{sub 60} have raised the possibility of overcoming this problem as they deposit the majority of their energy in the upper surface of the sample resulting in increased sputter yields but with a complimentary reduction in sub-surface damage accumulation. In this paper we report the depth profile analysis of the bio-polymer polycaprolactone, PCL, using the polyatomic ions Au{sub 3}{sup +} and C{sub 60}{sup +} and the monoatomic Au{sup +}. Results are compared to recent analysis of a similar sample using SF{sub 5}{sup +}. C{sub 60}{sup +} depth profiling of cellulose is also demonstrated, an experiment that has been reported as unsuccessful when attempted with SF{sub 5}{sup +} implications for biological analysis are discussed.

  18. Genetic Algorithm for Opto-thermal Skin Hydration Depth Profiling Measurements

    Science.gov (United States)

    Cui, Y.; Xiao, Perry; Imhof, R. E.

    2013-09-01

    Stratum corneum is the outermost skin layer, and the water content in stratum corneum plays a key role in skin cosmetic properties as well as skin barrier functions. However, to measure the water content, especially the water concentration depth profile, within stratum corneum is very difficult. Opto-thermal emission radiometry, or OTTER, is a promising technique that can be used for such measurements. In this paper, a study on stratum corneum hydration depth profiling by using a genetic algorithm (GA) is presented. The pros and cons of a GA compared against other inverse algorithms such as neural networks, maximum entropy, conjugate gradient, and singular value decomposition will be discussed first. Then, it will be shown how to use existing knowledge to optimize a GA for analyzing the opto-thermal signals. Finally, these latest GA results on hydration depth profiling of stratum corneum under different conditions, as well as on the penetration profiles of externally applied solvents, will be shown.

  19. Ultra-low energy Ar+ beam applied for SIMS depth profile analysis of layered nanostructures

    International Nuclear Information System (INIS)

    Konarski, P.; Mierzejewska, A.; Iwanejko, I.

    2001-01-01

    Secondary ion mass spectrometry (SIMS) depth profile analyses of flat layered nanostructures: 10 nm Ta 2 O 3 /Ta and 20 nm (10 x B 4 C/Mo)/Si as well as microparticles of core (illite) - shell (rutile) structure, performed with the use of ultra-low energy ion beam (180-880 eV, Ar + ), are presented. The profiles were obtained using 'mesa' scanning technique and also sample rotation. Depth profile resolution below 1 nanometer was obtained for flat nanostructures. Presented experimental results are compared with Monte Carlo sputtering simulations of analysed structures. A method of finding beam energy, optimal for the best resolution SIMS depth profile analysis, is suggested. (author)

  20. Determination of rock depth using artificial intelligence techniques

    Institute of Scientific and Technical Information of China (English)

    R. Viswanathan; Pijush Samui

    2016-01-01

    This article adopts three artificial intelligence techniques, Gaussian Process Regression (GPR), Least Square Support Vector Machine (LSSVM) and Extreme Learning Machine (ELM), for prediction of rock depth (d) at any point in Chennai. GPR, ELM and LSSVM have been used as regression techniques. Latitude and longitude are also adopted as inputs of the GPR, ELM and LSSVM models. The performance of the ELM, GPR and LSSVM models has been compared. The developed ELM, GPR and LSSVM models produce spatial variability of rock depth and offer robust models for the prediction of rock depth.

  1. Tritium depth profiling in carbon samples from fusion experiments

    International Nuclear Information System (INIS)

    Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.; Bekris, N.; Penzhorn, R.-D.

    2000-01-01

    Tritium depth profiling by accelerator mass spectrometry has been performed at the Rossendorf 3 MV Tandetron. Tritium particles are counted after the accelerator using a semiconductor detector, while deuterium and other light elements are simultaneously measured with the Faraday cup between the injection magnet and the accelerator. Depth profiles have been measured in carbon samples cut from the first wall tiles of the Garching fusion experiment ASDEX-Upgrade and of the European fusion experiment JET, Culham/UK. Tritium contents in the JET samples were up to six orders higher than in samples from ASDEX-Upgrade. Tritium beam currents from samples with high tritium content were measured partly in the Faraday cup before the accelerator. A dedicated tritium AMS facility with an air-insulated 100 kV tandem accelerator is under construction

  2. Measuring depth profiles of residual stress with Raman spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Enloe, W.S.; Sparks, R.G.; Paesler, M.A.

    1988-12-01

    Knowledge of the variation of residual stress is a very important factor in understanding the properties of machined surfaces. The nature of the residual stress can determine a part`s susceptibility to wear deformation, and cracking. Raman spectroscopy is known to be a very useful technique for measuring residual stress in many materials. These measurements are routinely made with a lateral resolution of 1{mu}m and an accuracy of 0.1 kbar. The variation of stress with depth; however, has not received much attention in the past. A novel technique has been developed that allows quantitative measurement of the variation of the residual stress with depth with an accuracy of 10nm in the z direction. Qualitative techniques for determining whether the stress is varying with depth are presented. It is also demonstrated that when the stress is changing over the volume sampled, errors can be introduced if the variation of the stress with depth is ignored. Computer aided data analysis is used to determine the depth dependence of the residual stress.

  3. Study of damaged depth profiles of ion-irradiated PEEK

    Czech Academy of Sciences Publication Activity Database

    Vacík, Jiří; Hnatowicz, Vladimír; Červená, Jarmila; Apel, P. Yu.; Posta, S.; Kobayashi, Y.

    2007-01-01

    Roč. 201, 19-20 (2007), s. 8370-8372 ISSN 0257-8972 R&D Projects: GA MPO(CZ) 1H-PK2/05; GA MŠk 1P04LA213 Institutional research plan: CEZ:AV0Z10480505 Keywords : Oxygen irradiation * Poly-aryl-ether-ether ketone * Thermal neutron depth profiling (TNDP) Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders Impact factor: 1.678, year: 2007

  4. On depth profiling of hydrogen and helium isotopes and its application to ion-implantation studies

    International Nuclear Information System (INIS)

    Boettiger, J.

    1979-01-01

    The thesis is divided into two parts, the first being a general review of the experimental methods for depth profiling of light isotopes, where ion beams are used. In the second part, studies of ion implantation of hydrogen and helium isotopes, applying the techniques discussed in the first part, are described. The paper summarizes recent experimental results and discusses recent developments. (Auth.)

  5. Opto-thermal moisture content and moisture depth profile measurements in organic materials

    NARCIS (Netherlands)

    Xiao, P.; Guo, X.; Cui, Y.Y.; Imhof, R.; Bicanic, D.D.

    2004-01-01

    Opto-thermal transient emission radiometry(OTTER) is a infrared remote sensing technique, which has been successfully used in in vivo skin moisture content and skin moisture depth profiling measurements.In present paper, we extend this moisture content measurement capability to analyze the moisture

  6. Depth profiling: RBS versus energy-dispersive X-ray imaging using scanning transmission electron microscopy

    International Nuclear Information System (INIS)

    Markwitz, Andreas

    2000-01-01

    Rutherford backscattering spectrometry (RBS) is known to be one of the techniques ideal for analysis of thin films. Elemental concentrations of matrix components and impurities can be investigated as well as depth profiles of almost each element of the periodic table. Best of all, RBS has both a high sensitivity and a high depth resolution, and is a non-destructive analysis technique that does not require specific sample preparation. Solid-state samples are mounted without preparation inside a high-vacuum analysis chamber. However, depth-related interpretation of elemental depth profiles requires the material density of the specimen and stopping power values to be taken into consideration. In many cases, these parameters can be estimated with sufficient precision. However, the assumed density can be inaccurate for depth scales in the nanometer range. For example, in the case of Ge nanoclusters in 500 nm thick SiO 2 layers, uncertainty is related to the actual position of a very thin Ge nanocluster band. Energy-dispersive X-ray emission (EDX) spectroscopy, using a high-resolution scanning transmission electron microscope (STEM) can assist in removing this uncertainty. By preparing a thin section of the specimen, EDX can be used to identify the position of the Ge nanocluster band very precisely, by correlating the Ge profile with the depth profiles of silicon and oxygen. However, extraction of the concentration profiles from STEM-EDX spectra is in general not straightforward. Therefore, a combination of the two very different analysis techniques is often the best and only successful way to extract high-resolution concentration profiles

  7. Photothermal radiometric determination of thermal diffusivity depth profiles in a dental resin

    International Nuclear Information System (INIS)

    MartInez-Torres, P; Alvarado-Gil, J J; Mandelis, A

    2010-01-01

    The depth of curing due to photopolymerization in a commercial dental resin is studied using photothermal radiometry. The sample consists of a thick layer of resin on which a thin metallic layer is deposited guaranteeing full opacity of the sample. In this case, purely thermal-wave inverse problem techniques without the interference of optical profiles can be used. Thermal profiles are obtained by heating the coating with a modulated laser beam and performing a modulation frequency scan. Before each frequency scan, photopolymerization was induced using a high power blue LED. However due to the fact that dental resins are highly light dispersive materials, the polymerization process depends strongly on the optical absorption coefficient inducing a depth dependent thermal diffusion in the sample. It is shown that using a robust depth profilometric inverse method one can reconstruct the thermal diffusivity profile of the photopolymerized resin.

  8. Deuterium depth profiles in metals using imaging field desorption

    International Nuclear Information System (INIS)

    Panitz, J.A.

    1976-01-01

    Depth profiles of 80 eV deuterium ions implanted in-situ into (110) tungsten have been measured by Imaging, Field-Desorption Mass Spectrometry. The relative abundance of deuterium was measured from the surface to a depth of 300A with less than 3A depth resolution by controlled field-evaporation of the specimen, and time-of-flight mass spectroscopy. The position of the depth distribution maximum (57 +- 3A from the surface) is shown to be in close agreement with that predicted theoretically for low energy deuterium implants using an amorphous-solid model. Structure in the distribution is attributed to surface morphology and channeling phenomena in the near surface region. Implanted impurity species from the ion source and tungsten surface have also been observed. For C + , C 2+ and 0 + , penetration is limited to less than 30A, with abundance decreasing exponentially from the surface. These results are interpreted in the context of the CTR first-wall impurity problem, and are used to suggest a novel method for in-situ characterization of low energy plasma species in operating CTR devices

  9. Depth profiling of boron implanted silicon by positron beam

    International Nuclear Information System (INIS)

    Oevuenc, S.

    2004-01-01

    Positron depth profiling analyses of low energy implants of silicon aim to observe tbe structure and density of the vacancies generating by implantation and the effect of annealing. This work present the results to several set of data starting S and W parameters. Boron implanted Silicon samples with different implantation energies,20,22,24,and 26 keV are analyzed by Slow positron beam (0-40 keV and 10 5 e + /s )(Variable Energy Positron) at the Positron Centre Delf-HOLLAND

  10. Factors that influence an elemental depth concentration profile

    International Nuclear Information System (INIS)

    McHugh, J.A.

    1975-01-01

    The use of secondary ion mass spectrometry in concentration profiling is discussed. Two classes of factors that influence an elemental concentration profile are instrumental effects and ion-matrix effects. Instrumental factors that must be considered are: (1) uniformity of the primary ion current density, (2) constancy of the primary ion current, (3) redeposition, (4) memory, (5) primary ion beam tailing and the nonfocused component, (6) chemical purity of the primary ion beam, and (7) residual gas impurities. Factors which can be classified as ion matrix effects are: (1) the mean escape depth of secondary ions, (2) recoil implantation, (3) molecular ion interferences, (4) primary ion beam induced diffusion of matrix species, (5) nonuniform sputter removal of matrix layers, and (6) implanted primary ion chemical and lattice damage effects

  11. Depth profiling by Raman spectroscopy of high-energy ion irradiated silicon carbide

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Xu; Zhang, Yanwen; Liu, Shiyi; Zhao, Ziqiang, E-mail: zqzhao@pku.edu.cn

    2014-01-15

    Single crystals of 6H–SiC were irradiated at room temperature with 20 MeV carbon ions at fluences of 1.5 × 10{sup 15} and 6.0 × 10{sup 15} cm{sup −2}. Raman measurements were performed to study irradiation induced damage and the in-depth damage profile of SiC. A clear change of damage from the surface down to the stopping region of carbon ions as simulated by SRIM is exhibited. The affected area as detected by Raman is in good agreement with SRIM predictions while a little shallower dpa profile is observed. The partial disorder defined in the present work as a function of depth is demonstrated. A shift of the position of the TO peak towards lower wavenumbers with in-depth damage and then to higher wavenumbers beyond the most damaged region indicates that tensile strain due to defects has a backward V-curve distribution. The damaged layer is subjected to a compressive in-plane stress associated with the out-of-plane strain and the magnitude of this stress also has a backward V-curve depth profile. The evolution of line width of the TO peak with depth clearly shows the density of defects reaches the higher level at the most damaged region. The Raman spectroscopy scanning technique is proved to be a powerful tool for profiling of crystal damage induced by high-energy ion implantation.

  12. Non destructive method of determination of depth profiling with ESCA spectroscopy by angular distribution

    International Nuclear Information System (INIS)

    Pijolat, Michele.

    1979-07-01

    The aim of this study has been to determine the possibilities of photoelectron spectroscopy ESCA for depth profiling in the first hundred angstrom of a compound. First of all, the technique ESCA has been described in an analytical point of view. Then, the common sputter profiling method has been tested, and a model to deduce the concentrations profile has been formulated. However the analysis of the various effects due to the sputtering events showed that this method is able to give only the profile shape with a bad depth resolution. A new non destructive method based on the analysed depth dependence with photoelectrons emission angle is settled. A computational method (simplexe optimization) is used to deduce the concentrations profile. Simulation have revealed the necessity of submitting constraints proper to the system physical properties and allowed to state the applicability range of the method. The interface profiles Ag-Pd, Ag-Al 2 O 3 and SiO 2 -Si have been measured, and the surface segregation in CuNi alloy has been studied [fr

  13. Z-depth integration: a new technique for manipulating z-depth properties in composited scenes

    Science.gov (United States)

    Steckel, Kayla; Whittinghill, David

    2014-02-01

    This paper presents a new technique in the production pipeline of asset creation for virtual environments called Z-Depth Integration (ZeDI). ZeDI is intended to reduce the time required to place elements at the appropriate z-depth within a scene. Though ZeDI is intended for use primarily in two-dimensional scene composition, depth-dependent "flat" animated objects are often critical elements of augmented and virtual reality applications (AR/VR). ZeDI is derived from "deep image compositing", a capacity implemented within the OpenEXR file format. In order to trick the human eye into perceiving overlapping scene elements as being in front of or behind one another, the developer must manually manipulate which pixels of an element are visible in relation to other objects embedded within the environment's image sequence. ZeDI improves on this process by providing a means for interacting with procedurally extracted z-depth data from a virtual environment scene. By streamlining the process of defining objects' depth characteristics, it is expected that the time and energy required for developers to create compelling AR/VR scenes will be reduced. In the proof of concept presented in this manuscript, ZeDI is implemented for pre-rendered virtual scene construction via an AfterEffects software plug-in.

  14. Quantitative depth profiling of near surface semiconductor structures using ultra low energy SIMS analysis

    International Nuclear Information System (INIS)

    Elliner, D.I.

    1999-09-01

    The continual reduction in size of semiconductor structures and depths of junctions is putting a greater strain on characterization techniques. Accurate device and process modelling requires quantified electrical and dopant profiles from the topmost few nanometres. Secondary ion mass spectrometry (SIMS) is an analytical technique commonly used in the semiconductor industry to measure concentration depth profiles. To allow the quantification of the features that are closer to the surface, lower energy ions are employed, which also improves the available depth resolution. The development of the floating ion gun (FLIG) has made it possible to use sub keV beam energies on a routine basis, allowing quantified dopant profiles to be obtained within the first few nanometres of the surface. This thesis demonstrates that, when profiling with oxygen ion beams, greatest certainty in the retained dose is achieved at normal incidence, and when analysing boron accurate profile shapes are only obtained when the primary beam energy is less than half that of the implant. It was shown that it is now possible to profile, though with slower erosion rates and a limited dynamic range, with 100 eV oxygen (0 2 + ) ion beams. Profile features that had developed during rapid thermal annealing, that could only be observed when ultra low energy ion beams were used, were investigated using various analytical techniques. Explanations of the apparently inactive dopant were proposed, and included suggestions for cluster molecules. The oxide thickness of fully formed altered layers has also been investigated. The results indicate that a fundamental change in the mechanism of oxide formation occurs, and interfaces that are sharper than those grown by thermal oxidation can be produced using sub-keV ion beams. (author)

  15. Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

    International Nuclear Information System (INIS)

    Miccio, Luis A.; Kummali, Mohammed M.; Alegria, Angel; Montemartini, Pablo E.; Oyanguren, Patricia A.; Schwartz, Gustavo A.; Colmenero, Juan

    2011-01-01

    By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.

  16. Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool

    International Nuclear Information System (INIS)

    Jeynes, C; Barradas, N P; Marriott, P K; Boudreault, G; Jenkin, M; Wendler, E; Webb, R P

    2003-01-01

    Rutherford backscattering spectrometry (RBS) and related techniques have long been used to determine the elemental depth profiles in films a few nanometres to a few microns thick. However, although obtaining spectra is very easy, solving the inverse problem of extracting the depth profiles from the spectra is not possible analytically except for special cases. It is because these special cases include important classes of samples, and because skilled analysts are adept at extracting useful qualitative information from the data, that ion beam analysis is still an important technique. We have recently solved this inverse problem using the simulated annealing algorithm. We have implemented the solution in the 'IBA DataFurnace' code, which has been developed into a very versatile and general new software tool that analysts can now use to rapidly extract quantitative accurate depth profiles from real samples on an industrial scale. We review the features, applicability and validation of this new code together with other approaches to handling IBA (ion beam analysis) data, with particular attention being given to determining both the absolute accuracy of the depth profiles and statistically accurate error estimates. We include examples of analyses using RBS, non-Rutherford elastic scattering, elastic recoil detection and non-resonant nuclear reactions. High depth resolution and the use of multiple techniques simultaneously are both discussed. There is usually systematic ambiguity in IBA data and Butler's example of ambiguity (1990 Nucl. Instrum. Methods B 45 160-5) is reanalysed. Analyses are shown: of evaporated, sputtered, oxidized, ion implanted, ion beam mixed and annealed materials; of semiconductors, optical and magnetic multilayers, superconductors, tribological films and metals; and of oxides on Si, mixed metal silicides, boron nitride, GaN, SiC, mixed metal oxides, YBCO and polymers. (topical review)

  17. Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

    Science.gov (United States)

    Willingham, D; Brenes, D. A.; Wucher, A

    2009-01-01

    Molecular depth profiles of an organic thin film of guanine vapor deposited onto a Ag substrate are obtained using a 40 keV C60 cluster ion beam in conjunction with time-of-flight secondary ion mass spectrometric (ToF-SIMS) detection. Strong-field, femtosecond photoionization of intact guanine molecules is used to probe the neutral component of the profile for direct comparison with the secondary ion component. The ability to simultaneously acquire secondary ions and photoionized neutral molecules reveals new fundamental information about the factors that influence the properties of the depth profile. Results show that there is an increased ionization probability for protonated molecular ions within the first 10 nm due to the generation of free protons within the sample. Moreover, there is a 50% increase in fragment ion signal relative to steady state values 25 nm before reaching the guanine/Ag interface as a result of interfacial chemical damage accumulation. An altered layer thickness of 20 nm is observed as a consequence of ion beam induced chemical mixing. In general, we show that the neutral component of a molecular depth profile using the strong-field photoionization technique can be used to elucidate the effects of variations in ionization probability on the yield of molecular ions as well as to aid in obtaining accurate information about depth dependent chemical composition that cannot be extracted from TOF-SIMS data alone. PMID:20495665

  18. A continuous OSL scanning method for analysis of radiation depth-dose profiles in bricks

    DEFF Research Database (Denmark)

    Bøtter-Jensen, L.; Jungner, H.; Poolton, N.R.J.

    1995-01-01

    This article describes the development of a method for directly measuring radiation depth-dose profiles from brick, tile and porcelain cores, without the need for sample separation techniques. For the brick cores, examples are shown of the profiles generated by artificial irradiation using...... the different photon energies from Cs-137 and Co-60 gamma sources; comparison is drawn with both the theoretical calculations derived from Monte Carlo simulations, as well as experimental measurements made using more conventional optically stimulated luminescence methods of analysis....

  19. Identification of Chinese medicinal fungus Cordyceps sinensis by depth-profiling mid-infrared photoacoustic spectroscopy

    Science.gov (United States)

    Du, Changwen; Zhou, Jianmin; Liu, Jianfeng

    2017-02-01

    With increased demand for Cordyceps sinensis it needs rapid methods to meet the challenge of identification raised in quality control. In this study Cordyceps sinensis from four typical natural habitats in China was characterized by depth-profiling Fourier transform infrared photoacoustic spectroscopy. Results demonstrated that Cordyceps sinensis samples resulted in typical photoacoustic spectral appearance, but heterogeneity was sensed in the whole sample; due to the heterogeneity Cordyceps sinensis was represented by spectra of four groups including head, body, tail and leaf under a moving mirror velocity of 0.30 cm s- 1. The spectra of the four groups were used as input of a probabilistic neural network (PNN) to identify the source of Cordyceps sinensis, and all the samples were correctly identified by the PNN model. Therefore, depth-profiling Fourier transform infrared photoacoustic spectroscopy provides novel and unique technique to identify Cordyceps sinensis, which shows great potential in quality control of Cordyceps sinensis.

  20. Experimental analysis of bruises in human volunteers using radiometric depth profiling and diffuse reflectance spectroscopy

    Science.gov (United States)

    Vidovič, Luka; Milanič, Matija; Majaron, Boris

    2015-07-01

    We combine pulsed photothermal radiometry (PPTR) depth profiling with diffuse reflectance spectroscopy (DRS) measurements for a comprehensive analysis of bruise evolution in vivo. While PPTR enables extraction of detailed depth distribution and concentration profiles of selected absorbers (e.g. melanin, hemoglobin), DRS provides information in a wide range of visible wavelengths and thus offers an additional insight into dynamics of the hemoglobin degradation products. Combining the two approaches enables us to quantitatively characterize bruise evolution dynamics. Our results indicate temporal variations of the bruise evolution parameters in the course of bruise self-healing process. The obtained parameter values and trends represent a basis for a future development of an objective technique for bruise age determination.

  1. Sub-nanometer resolution XPS depth profiling: Sensing of atoms

    Energy Technology Data Exchange (ETDEWEB)

    Szklarczyk, Marek, E-mail: szklarcz@chem.uw.edu.pl [Faculty of Chemistry, University of Warsaw, ul. Pasteura 1, 02-093 Warsaw (Poland); Shim-Pol, ul. Lubomirskiego 5, 05-080 Izabelin (Poland); Macak, Karol; Roberts, Adam J. [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom); Takahashi, Kazuhiro [Kratos XPS Section, Shimadzu Corp., 380-1 Horiyamashita, Hadano, Kanagawa 259-1304 (Japan); Hutton, Simon [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom); Głaszczka, Rafał [Shim-Pol, ul. Lubomirskiego 5, 05-080 Izabelin (Poland); Blomfield, Christopher [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom)

    2017-07-31

    Highlights: • Angle resolved photoelectron depth profiling of nano thin films. • Sensing atomic position in SAM films. • Detection of direction position of adsorbed molecules. - Abstract: The development of a method capable of distinguishing a single atom in a single molecule is important in many fields. The results reported herein demonstrate sub-nanometer resolution for angularly resolved X-ray photoelectron spectroscopy (ARXPS). This is made possible by the incorporation of a Maximum Entropy Method (MEM) model, which utilize density corrected electronic emission factors to the X-ray photoelectron spectroscopy (XPS) experimental results. In this paper we report on the comparison between experimental ARXPS results and reconstructed for both inorganic and organic thin film samples. Unexpected deviations between experimental data and calculated points are explained by the inaccuracy of the constants and standards used for the calculation, e.g. emission factors, scattering intensity and atomic density through the studied thickness. The positions of iron, nitrogen and fluorine atoms were determined in the molecules of the studied self-assembled monolayers. It has been shown that reconstruction of real spectroscopic data with 0.2 nm resolution is possible.

  2. 3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures

    Energy Technology Data Exchange (ETDEWEB)

    Hourani, W. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Gorbenko, V. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Univ. Grenoble Alpes, LTM, CNRS, F-38000 Grenoble (France); Barnes, J.-P.; Guedj, C. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Cipro, R.; Moeyaert, J.; David, S.; Bassani, F.; Baron, T. [Univ. Grenoble Alpes, LTM, CNRS, F-38000 Grenoble (France); Martinez, E., E-mail: eugenie.martinez@cea.fr [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France)

    2016-11-15

    Highlights: • The nanoscale chemical characterization of III–V heterostructures is performed using Auger depth profiling below decananometric spatial resolution. • Reliable indium quantification is achieved on planar structures for thicknesses down to 9 nm. • Quantitative 3D compositional depth profiles are obtained on patterned structures, with sufficient lateral resolution to analyze one single trench. • The Auger intrinsic spatial resolution is estimated around 150–200 nm using a comparison with HAADF-STEM. • Auger and SIMS provide reliable in-depth chemical analysis of such complex 3D heterostructures, in particular regarding indium quantification. - Abstract: The nanoscale chemical characterization of III–V heterostructures is performed using Auger depth profiling below decananometric spatial resolution. This technique is successfully applied to quantify the elemental composition of planar and patterned III–V heterostructures containing InGaAs quantum wells. Reliable indium quantification is achieved on planar structures for thicknesses down to 9 nm. Quantitative 3D compositional depth profiles are obtained on patterned structures, for trench widths down to 200 nm. The elemental distributions obtained in averaged and pointed mode are compared. For this last case, we show that Zalar rotation during sputtering is crucial for a reliable indium quantification. Results are confirmed by comparisons with secondary ion mass spectrometry, photoluminescence spectroscopy, transmission electron microscopy and electron dispersive X-ray spectroscopy. The Auger intrinsic spatial resolution is quantitatively measured using an original methodology based on the comparison with high angle annular dark field scanning transmission electron microscopy measurements at the nanometric scale.

  3. Design and construction of an analytical instrument for neutron depth profiling

    International Nuclear Information System (INIS)

    Mutis, Octavio; Venegas, Rafael

    1998-01-01

    Full text: An experimental facility for Neutron Depth Profiling, recently constructed at CCHEN's laboratories is described. The technique allows to measure the mean atomic concentration ρ(x) of certain isotopes as a function of distance x to the surface for the first depth microns. The observation area is about 15 mm in diameter and the range in depth depends on the matrix stopping power and on the energy of the charged particle associated with the A(n,y)B reaction, in which this technique is supported, where A is the isotope to be detected, y is an α particle or a proton and B is the recoil nucleus. The spatial resolution depends upon the characteristics of the detection chain and its geometry and of the thermal spectrum of the beam. An appropriate deconvolution on the merging particle energy spectrum allows to recover the concentration profile. The application of the technique to the analysis of some phospho borosilicate films deposited on s Si substrate, lithium tantalate ceramics deposited on Si substrate and a sintered of lithium and Zn-Ni-Mn oxide are shown here with a resolution comparative to that of advanced laboratories

  4. Using elastic peak electron spectroscopy for enhanced depth resolution in sputter profiling

    International Nuclear Information System (INIS)

    Hofmann, S.; Kesler, V.

    2002-01-01

    Elastic peak electron spectroscopy (EPES) is an alternative to AES in sputter depth profiling of thin film structures. In contrast to AES, EPES depth profiling is not influenced by chemical effects. The high count rate ensures a good signal to noise ratio, that is lower measurement times and/or higher precision. In addition, because of the elastically scattered electrons travel twice through the sample, the effective escape depth is reduced, an important factor for the depth resolution function. Thus, the depth resolution is increased. EPES depth profiling was successfully applied to a Ge/Si multilayer structure. For an elastic peak energy of 1.0 keV the information depth is considerably lower (0.8 nm) as compared to the Ge (LMM, 1147 eV) peak (1.6 nm) used in AES depth profiling, resulting in a respectively improved depth resolution for EPES profiling under otherwise similar profiling conditions. EPES depth profiling is successfully applied to measure small diffusion lengths at Ge/Si interfaces of the order of 1 nm. (Authors)

  5. Electrochemical depth profiling of multilayer metallic structures: An aluminum brazing sheet

    International Nuclear Information System (INIS)

    Afshar, F. Norouzi; Ambat, R.; Kwakernaak, C.; Wit, J.H.W. de; Mol, J.M.C.; Terryn, H.

    2012-01-01

    Highlights: ► Localized electrochemical cell and glow discharge optical emission spectrometry were used. ► An electrochemical depth profile of an aluminum brazing sheet was obtained. ► The electrochemical responses were correlated to the microstructural features. - Abstract: Combinatory localized electrochemical cell and glow discharge optical emission spectrometry (GDOES) measurements were performed to obtain a thorough in depth electrochemical characterization of an aluminum brazing sheet. By defining electrochemical criteria i.e. breakdown potential, corrosion potential, cathodic and anodic reactivities, and tracking their changes as a function of depth, the evolution of electrochemical responses through out the material thickness were analyzed and correlated to the corresponding microstructural features. Polarization curves in 1 wt% NaCl solution at pH 2.8 were obtained at different depths from the surface using controlled sputtering in a glow discharge optical emission spectrometer as a sample preparation technique. The anodic and cathodic reactivity of the top surface areas were significantly higher than that of the bulk, thus indicating these areas to be more susceptible to localized attack. Consistent with this, optical microscopy and scanning electron microscope analysis revealed a relatively high density of fine intermetallic and silicon particles at these areas. The corrosion mechanism of the top layers was identified to be intergranular and pitting corrosion, while lower sensitivity to these localized attacks were detected toward the brazing sheet core. The results highlight the successful application of the electrochemical depth profiling approach in prediction of the corrosion behavior of the aluminum brazing sheet and the importance of the electrochemical activity of the outer 10 μm in controlling the corrosion performance of the aluminum brazing sheet.

  6. Refractive index depth profile in PMMA due to proton irradiation

    International Nuclear Information System (INIS)

    Szilasi, S.Z.; Rajta, I.; Budai, J.; Toth, Z.; Petrik, P.; Baradacs, E.

    2006-01-01

    Complete text of publication follows. During Proton Beam Writing the beam damage causes chain scissioning in the polymer resist material (e.g. PMMA (Polymethyl methacrylate)), producing smaller molecular weight chains. Hydrogen implantation also takes place at the end of range. Compaction of the sample has been observed too, which means that the sample density becomes higher at the places where proton irradiation occurred. Furthermore, P-beam Writing has been successfully used to create buried channel waveguides in PMMA [1], since proton irradiation increases the refractive index. There are two ways of fabricating waveguides using P-beam Writing, one of them applies direct micromachining of the high refractive index core followed by the coating of a lower refractive index cladding layer. In this application the refractive indices of the substrate, the core and the cladding have to be known, which should be homogeneous within the whole structure. The other method allows producing buried waveguides. In this case proton beam writing is used to modify the refractive index along the ion path in the sample, where most of the ion energy is deposited near the end of range also known as the Bragg peak. For polymers 10 -3 refractive index change has been reported, which is usually sufficient for forming waveguides. Those measurements of the refractive index change have been performed by the refracted near field technique. In this work we used ellipsometry, in order to measure the optical parameters of the P-beam treated sample near the surface, and along the Bragg curve. Ellipsometry measures the change in the polarization state of light occurring during reflection. This change is related to the quality of the reflecting surface (i.e. the physical structure, layer thicknesses, optical constants, surface roughness, etc.). >From these measurements the refractive index and the extinction coefficient can be determined rather accurately, which makes ellipsometry a powerful tool

  7. Model for hydrogen isotope backscattering, trapping and depth profiles in C and a-Si

    International Nuclear Information System (INIS)

    Cohen, S.A.; McCracken, G.M.

    1979-03-01

    A model of low energy hydrogen trapping and backscattering in carbon and a-silicon is described. Depth profiles are calculated and numerical results presented for various incident angular and energy distributions. The calculations yield a relation between depth profiles and the incident ion energy distribution. The use of this model for tokamak plasma diagnosis is discussed

  8. Objective characterization of bruise evolution using photothermal depth profiling and Monte Carlo modeling

    Science.gov (United States)

    Vidovič, Luka; Milanič, Matija; Majaron, Boris

    2015-01-01

    Pulsed photothermal radiometry (PPTR) allows noninvasive determination of laser-induced temperature depth profiles in optically scattering layered structures. The obtained profiles provide information on spatial distribution of selected chromophores such as melanin and hemoglobin in human skin. We apply the described approach to study time evolution of incidental bruises (hematomas) in human subjects. By combining numerical simulations of laser energy deposition in bruised skin with objective fitting of the predicted and measured PPTR signals, we can quantitatively characterize the key processes involved in bruise evolution (i.e., hemoglobin mass diffusion and biochemical decomposition). Simultaneous analysis of PPTR signals obtained at various times post injury provides an insight into the variations of these parameters during the bruise healing process. The presented methodology and results advance our understanding of the bruise evolution and represent an important step toward development of an objective technique for age determination of traumatic bruises in forensic medicine.

  9. The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profiles

    International Nuclear Information System (INIS)

    Carter, G.; Katardjiev, I.V.; Nobes, M.J.

    1989-01-01

    The quasi-linear partial differential continuity equations that describe the evolution of the depth profiles and surface concentrations of marker atoms in kinematically equivalent systems undergoing sputtering, ion collection and atomic mixing are solved using the method of characteristics. It is shown how atomic mixing probabilities can be deduced from measurements of ion collection depth profiles with increasing ion fluence, and how this information can be used to predict surface concentration evolution. Even with this information, however, it is shown that it is not possible to deconvolute directly the surface concentration measurements to provide initial depth profiles, except when only ion collection and sputtering from the surface layer alone occur. It is demonstrated further that optimal recovery of initial concentration depth profiles could be ensured if the concentration-measuring analytical probe preferentially sampled depths near and at the maximum depth of bombardment-induced perturbations. (author)

  10. Depth profiling of extended defects in silicon by Rutherford backscattering measurements

    International Nuclear Information System (INIS)

    Gruska, B.; Goetz, G.

    1981-01-01

    Depth profiling of dislocations and stacking faults is carried out by analyzing axial and planar channeling data from As + -and P + -implanted silicon samples annealed at high temperatures. The analyzing procedure is based on the simple two-beam model. The results show that depth profiling of dislocations using planar channeling data is connected with a broadening of the real distributions. A degradation of the defect concentration and a deformation of the profile result for very high defect concentrations (> 5 x 10 5 cm/cm 2 ). All these effects can be neglected by analyzing axial channeling data. Depth profiling of stacking faults is restricted to the determination of the depth distribution of displaced atomic rows or planes. For both the procedures, axial as well as planar channeling measurements, the same depth profiles of displaced atomic rows are obtained. (author)

  11. Molecular depth profiling of trehalose using a C{sub 60} cluster ion beam

    Energy Technology Data Exchange (ETDEWEB)

    Wucher, Andreas [Department of Physics, University of Duisburg-Essen, D-47048 Duisburg (Germany)], E-mail: andreas.wucher@uni-due.de; Cheng Juan; Winograd, Nicholas [Department of Chemistry, Pennsylvania State University, University Park, PA 16802 (United States)

    2008-12-15

    Molecular depth profiling of organic overlayers was performed using a mass selected fullerene ion beam in conjunction with time-of-flight (TOF-SIMS) mass spectrometry. The characteristics of depth profiles acquired on a 300-nm trehalose film on Si were studied as a function of the impact kinetic energy and charge state of the C{sub 60} projectile ions. We find that the achieved depth resolution depends only weakly upon energy.

  12. Depth profile of In and As in Si measured by RBS with He and C ions

    Energy Technology Data Exchange (ETDEWEB)

    Yang, Q; Fang, Z [Newcastle Univ., NSW (Australia). Dept. of Physics; Ophel, T R [Australian National Univ., Canberra, ACT (Australia). Dept. of Nuclear Physics

    1994-12-31

    The depth profile of As and In implanted into Si have been measured by RBS (Rutherford Backscattering Spectrometry) with 2 MeV He ions and 6 MeV C ions. Advantages of enhanced depth and mass resolution with C ions have been demonstrated over the conventional He RBS. More reliable information for the depth profile of In and As in Si has been obtained. 12 refs., 3 figs.

  13. Depth profile of In and As in Si measured by RBS with He and C ions

    Energy Technology Data Exchange (ETDEWEB)

    Yang, Q.; Fang, Z. [Newcastle Univ., NSW (Australia). Dept. of Physics; Ophel, T.R. [Australian National Univ., Canberra, ACT (Australia). Dept. of Nuclear Physics

    1993-12-31

    The depth profile of As and In implanted into Si have been measured by RBS (Rutherford Backscattering Spectrometry) with 2 MeV He ions and 6 MeV C ions. Advantages of enhanced depth and mass resolution with C ions have been demonstrated over the conventional He RBS. More reliable information for the depth profile of In and As in Si has been obtained. 12 refs., 3 figs.

  14. A small and compact AMS facility for tritium depth profiling

    Indian Academy of Sciences (India)

    Depth profiling measurements of tritium in carbon samples have been performed during the past seven years at the AMS facility installed at the Rossendorf 3 MV Tandetron. The samples have been cut from the inner walls of the fusion experiments ASDEX-upgrade/Garching and JET/Culham. The tritium content of the ...

  15. Depth-To-Basement Mapping Using Fractal Technique: Application ...

    African Journals Online (AJOL)

    ... and can thus be obtained at source level. Application to aeromagnetic data from the Chad basin north eastern Nigeria produced a basement relief which range from depths of 2.47 km to 5.40 km with an average of 3.92 +- 0.66 km. Keywords: Fractal, depth, basement, spectra, aeromagnetic. Nigerian Journal of Physics Vol ...

  16. Depth profiling of helium in Ni and Nb; comparison of different methods

    International Nuclear Information System (INIS)

    Scherzer, B.M.U.; Bay, H.L.; Behrisch, R.; Boergesen, P.; Roth, J.

    1978-01-01

    Depth profiles of 30 keV 3 He + and 4 He + implanted in polycrystalline nickel and single crystal niobium have been measured using the nuclear reactions He(p,p)He and 3 He(d,α) 1 H. The formalism for obtaining depth profiles from Rutherford backscattering spectra has been generalized for the application to nuclear reaction spectra. The profiles obtained by the two different methods agree within the errors introduced by the uncertainties of the reaction cross-section and electronic stopping power data. The 3 He(d,α) 1 H method is a factor of 10-100 more sensitive and has about a factor of 5 better depth resolution than the He(p,p)He method. However, the latter method allows to probe much larger depths and is simultaneously applicable to 4 He as well as to 3 He. Within the experimental uncertainties the depth profiles for 3 He and 4 He are identical. (Auth.)

  17. Compressive and Shear Wave Velocity Profiles using Seismic Refraction Technique

    International Nuclear Information System (INIS)

    Aziman, M; Hazreek, Z A M; Azhar, A T S; Haimi, D S

    2016-01-01

    Seismic refraction measurement is one of the geophysics exploration techniques to determine soil profile. Meanwhile, the borehole technique is an established way to identify the changes of soil layer based on number of blows penetrating the soil. Both techniques are commonly adopted for subsurface investigation. The seismic refraction test is a non-destructive and relatively fast assessment compared to borehole technique. The soil velocities of compressive wave and shear wave derived from the seismic refraction measurements can be directly utilised to calculate soil parameters such as soil modulus and Poisson’s ratio. This study investigates the seismic refraction techniques to obtain compressive and shear wave velocity profile. Using the vertical and horizontal geophones as well as vertical and horizontal strike directions of the transient seismic source, the propagation of compressive wave and shear wave can be examined, respectively. The study was conducted at Sejagung Sri Medan. The seismic velocity profile was obtained at a depth of 20 m. The velocity of the shear wave is about half of the velocity of the compression wave. The soil profiles of compressive and shear wave velocities were verified using the borehole data and showed good agreement with the borehole data. (paper)

  18. Determination of in-depth contamination in concrete using a non-destructive technique

    International Nuclear Information System (INIS)

    Boden, S.; Cantrel, E.

    2007-01-01

    The decommissioning of the BR3 (Belgian Reactor 3) approaches its final phase, in which the building structures are being decontaminated and either denuclearized for possible reuse or demolished. Apart from the presence of naturally occurring radionuclides in building materials, other radionuclides might be present due to activation or contamination. The BR3 bioshield has been exposed to rather high neutron leakage fluxes during the reactor operation and is therefore activated. Building structure contamination usually results from leakages during reactor operation, releases due to maintenance works or even dismantling operations. In case of in-depth contamination in concrete it is important to know the exact in-depth profile before decontamination, in order to minimize the amount of radioactive waste that will be produced during the decontamination process and to optimize both the decontamination process and the final control measurements. Common non-destructive analyses used in decommissioning are usually based on the measurement of beta radiation, using e.g. hand-held plastic scintillators. This kind of measurement technique can not be used to determine in-depth contamination. Therefore, most of the decontamination specialists currently base themselves on the results of the radiological analysis of samples taken by core drilling. The use of such a destructive method implies a number of disadvantages: it is time consuming and therefore costly and the different sample preparation steps can conceivably lead to cross-contamination. Moreover, one only receives results of a limited number of points, while the in-depth contamination is usually very inhomogeneously distributed and the relationship between in-depth contamination and surface contamination and/or dose rate (hotspot detection) is generally rather poor.The objective therefore is to test the use of the ISOCS (In Situ Object Counting System) for the determination of contamination depth

  19. Do different probing depths exhibit striking differences in microbial profiles?

    Science.gov (United States)

    Pérez-Chaparro, Paula Juliana; McCulloch, John Anthony; Mamizuka, Elsa Masae; Moraes, Aline da Costa Lima; Faveri, Marcelo; Figueiredo, Luciene Cristina; Duarte, Poliana Mendes; Feres, Magda

    2018-01-01

    To perform a thorough characterization of the subgingival microbiota of shallow, moderate and deep sites in subjects with chronic periodontitis (ChP). Subgingival samples were collected from subjects with ChP (n = 3/category of probing depth: ≤3, 4-6 and ≥7 mm) and periodontal health (PH). Individual samples were submitted to 16S rDNA high- throughput sequencing and the analysis was made using mothur and R packages. Nine subjects with ChP and seven with PH were included and 101 samples were evaluated. Thirteen phyla, 118 genera and 211 OTUs were detected. Taxa from Chloroflexi and Spirochaetes phyla were associated with initial stages of disease. Fretibacterium, Eubacterium[XI][G-6], Desulfobulbus, Peptostreptococcaceae[XI][G-1] and [G-3], Bacteroidetes[G-3], Bacteroidaceae[G-1] genera and Filifactor alocis, Fretibacterium fastidiosum, Johnsonella spHOT166, Peptostreptococcaceae[XIII][G-1]HOT113, Porphyromonas endodontalis and Treponema sp. HOT258, which are not conventionally associated with disease, increased with the deepening of the pockets and/or were elevated in ChP; while Streptococcus, Corynebacterium and Bergeyella genera were associated with PH (p oral microorganisms and newly identified periodontal taxa, some of them not-yet-cultured. © 2017 John Wiley & Sons A/S. Published by John Wiley & Sons Ltd.

  20. Breadth and Depth of Vocabulary Knowledge and Their Effects on L2 Vocabulary Profiles

    Science.gov (United States)

    Bardakçi, Mehmet

    2016-01-01

    Breadth and depth of vocabulary knowledge have been studied from many different perspectives, but the related literature lacks serious studies dealing with their effects on vocabulary profiles of EFL learners. In this paper, with an aim to fill this gap, the relative effects of breadth and depth of vocabulary knowledge on L2 vocabulary profiles…

  1. Buoyancy frequency profiles and internal semidiurnal tide turning depths in the oceans

    OpenAIRE

    King, B.; Stone, M.; Zhang, H.P.; Gerkema, T.; Marder, M.; Scott, R.B.; Swinney, H.L.

    2012-01-01

    We examine the possible existence of internal gravity wave "turning depths," depths below which the local buoyancy frequency N(z) becomes smaller than the wave frequency. At a turning depth, incident gravity waves reflect rather than reaching the ocean bottom as is generally assumed. Here we consider internal gravity waves at the lunar semidiurnal (M-2) tidal frequency, omega(M2). Profiles of N-2(z) (the quantity in the equations of motion) are computed using conductivity, temperature, and de...

  2. Development of an ion time-of-flight spectrometer for neutron depth profiling

    Science.gov (United States)

    Cetiner, Mustafa Sacit

    Ion time-of-flight spectrometry techniques are investigated for applicability to neutron depth profiling. Time-of-flight techniques are used extensively in a wide range of scientific and technological applications including energy and mass spectroscopy. Neutron depth profiling is a near-surface analysis technique that gives concentration distribution versus depth for certain technologically important light elements. The technique uses thermal or sub-thermal neutrons to initiate (n, p) or (n, alpha) reactions. Concentration versus depth distribution is obtained by the transformation of the energy spectrum into depth distribution by using stopping force tables of the projectiles in the substrate, and by converting the number of counts into concentration using a standard sample of known dose value. Conventionally, neutron depth profiling measurements are based on charged particle spectrometry, which employs semiconductor detectors such as a surface barrier detector (SBD) and the associated electronics. Measurements with semiconductor detectors are affected by a number of broadening mechanisms, which result from the interactions between the projectile ion and the detector material as well as fluctuations in the signal generation process. These are inherent features of the detection mechanism that involve the semiconductor detectors and cannot be avoided. Ion time-of-flight spectrometry offers highly precise measurement capabilities, particularly for slow particles. For high-energy low-mass particles, measurement resolution tends to degrade with all other parameters fixed. The threshold for more precise ion energy measurements with respect to conventional techniques, such as direct energy measurement by a surface barrier detector, is directly related to the design and operating parameters of the device. Time-of-flight spectrometry involves correlated detection of two signals by a coincidence unit. In ion time-of-flight spectroscopy, the ion generates the primary input

  3. Micro-Raman depth profile investigations of beveled Al+-ion implanted 6H-SiC samples

    International Nuclear Information System (INIS)

    Zuk, J.; Romanek, J.; Skorupa, W.

    2009-01-01

    6H-SiC single crystals were implanted with 450 keV Al + -ions to a fluence of 3.4 x 10 15 cm -2 , and in a separate experiment subjected to multiple Al + implantations with the four energies: 450, 240, 115 and 50 keV and different fluences to obtain rectangular-like depth distributions of Al in SiC. The implantations were performed along [0 0 0 1] channeling and non-channeling ('random') directions. Subsequently, the samples were annealed for 10 min at 1650 deg. C in an argon atmosphere. The depth profiles of the implanted Al atoms were obtained by secondary ion mass spectrometry (SIMS). Following implantation and annealing, the samples were beveled by mechanical polishing. Confocal micro-Raman spectroscopic investigations were performed with a 532 nm wavelength laser beam of a 1 μm focus diameter. The technique was used to determine precisely the depth profiles of TO and LO phonon lines intensity in the beveled samples to a depth of about 2000 nm. Micro-Raman spectroscopy was also found to be useful in monitoring very low levels of disorder remaining in the Al + implanted and annealed 6H-SiC samples. The micro-Raman technique combined with sample beveling also made it possible the determination of optical absorption coefficient profiles in implanted subsurface layers.

  4. Use of machine learning techniques for modeling of snow depth

    Directory of Open Access Journals (Sweden)

    G. V. Ayzel

    2017-01-01

    Full Text Available Snow exerts significant regulating effect on the land hydrological cycle since it controls intensity of heat and water exchange between the soil-vegetative cover and the atmosphere. Estimating of a spring flood runoff or a rain-flood on mountainous rivers requires understanding of the snow cover dynamics on a watershed. In our work, solving a problem of the snow cover depth modeling is based on both available databases of hydro-meteorological observations and easily accessible scientific software that allows complete reproduction of investigation results and further development of this theme by scientific community. In this research we used the daily observational data on the snow cover and surface meteorological parameters, obtained at three stations situated in different geographical regions: Col de Porte (France, Sodankyla (Finland, and Snoquamie Pass (USA.Statistical modeling of the snow cover depth is based on a complex of freely distributed the present-day machine learning models: Decision Trees, Adaptive Boosting, Gradient Boosting. It is demonstrated that use of combination of modern machine learning methods with available meteorological data provides the good accuracy of the snow cover modeling. The best results of snow cover depth modeling for every investigated site were obtained by the ensemble method of gradient boosting above decision trees – this model reproduces well both, the periods of snow cover accumulation and its melting. The purposeful character of learning process for models of the gradient boosting type, their ensemble character, and use of combined redundancy of a test sample in learning procedure makes this type of models a good and sustainable research tool. The results obtained can be used for estimating the snow cover characteristics for river basins where hydro-meteorological information is absent or insufficient.

  5. Application of Depth-Averaged Velocity Profile for Estimation of Longitudinal Dispersion in Rivers

    Directory of Open Access Journals (Sweden)

    Mohammad Givehchi

    2010-01-01

    Full Text Available River bed profiles and depth-averaged velocities are used as basic data in empirical and analytical equations for estimating the longitudinal dispersion coefficient which has always been a topic of great interest for researchers. The simple model proposed by Maghrebi is capable of predicting the normalized isovel contours in the cross section of rivers and channels as well as the depth-averaged velocity profiles. The required data in Maghrebi’s model are bed profile, shear stress, and roughness distributions. Comparison of depth-averaged velocities and longitudinal dispersion coefficients observed in the field data and those predicted by Maghrebi’s model revealed that Maghrebi’s model had an acceptable accuracy in predicting depth-averaged velocity.

  6. SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?

    Energy Technology Data Exchange (ETDEWEB)

    Gorondy-Novak, S. [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France); Jomard, F. [Groupe d' Etude de la Matière Condensée, CNRS, UVSQ, 45 avenue des Etats-Unis, 78035 Versailles cedex (France); Prima, F. [PSL Research University, Chimie ParisTech – CNRS, Institut de Recherche de Chimie Paris, 75005 Paris (France); Lefaix-Jeuland, H., E-mail: helene.lefaix@cea.fr [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France)

    2017-05-01

    Reliable He profiles are highly desirable for better understanding helium behavior in materials for future nuclear applications. Recently, Secondary Ions Mass Spectrometry (SIMS) allowed the characterization of helium distribution in as-implanted metallic systems. The Cs{sup +} primary ion beam coupled with CsHe{sup +} molecular detector appeared to be a promising technique which overcomes the very high He ionization potential. In this study, {sup 4}He depth profiles in pure body centered cubic (bcc) metals (V, Fe, Ta, Nb and Mo) as-implanted and annealed, were obtained by SIMS. All as-implanted samples exhibited a projected range of around 200 nm, in agreement with SRIM theoretical calculations. After annealing treatment, SIMS measurements evidenced the evolution of helium depth profile with temperature. The latter SIMS results were compared to the helium bubble distribution obtained by Transmission Electron Microscopy (TEM). This study confirmed the great potential of this experimental procedure as a He-depth profiling technique in bcc metals. Indeed, the methodology described in this work could be extended to other materials including metallic and non-metallic compounds. Nevertheless, the quantification of helium concentration after annealing treatment by SIMS remains uncertain probably due to the non-uniform ionization efficiency in samples containing large bubbles.

  7. SU-E-T-561: Development of Depth Dose Measurement Technique Using the Multilayer Ionization Chamber for Spot Scanning Method

    International Nuclear Information System (INIS)

    Takayanagi, T; Fujitaka, S; Umezawa, M; Ito, Y; Nakashima, C; Matsuda, K

    2014-01-01

    Purpose: To develop a measurement technique which suppresses the difference between profiles obtained with a multilayer ionization chamber (MLIC) and with a water phantom. Methods: The developed technique multiplies the raw MLIC data by a correction factor that depends on the initial beam range and water equivalent depth. The correction factor is derived based on a Bragg curve calculation formula considering range straggling and fluence loss caused by nuclear reactions. Furthermore, the correction factor is adjusted based on several integrated depth doses measured with a water phantom and the MLIC. The measured depth dose profiles along the central axis of the proton field with a nominal field size of 10 by 10 cm were compared between the MLIC using the new technique and the water phantom. The spread out Bragg peak was 20 cm for fields with a range of 30.6 cm and 6.9 cm. Raw MLIC data were obtained with each energy layer, and integrated after multiplying by the correction factor. The measurements were performed by a spot scanning nozzle at Nagoya Proton Therapy Center, Japan. Results: The profile measured with the MLIC using the new technique is consistent with that of the water phantom. Moreover, 97% of the points passed the 1% dose /1mm distance agreement criterion of the gamma index. Conclusion: We have demonstrated that the new technique suppresses the difference between profiles obtained with the MLIC and with the water phantom. It was concluded that this technique is useful for depth dose measurement in proton spot scanning method

  8. Ultra-shallow arsenic implant depth profiling using low-energy nitrogen beams

    International Nuclear Information System (INIS)

    Fearn, Sarah; Chater, Richard; McPhail, David

    2004-01-01

    Sputtering of silicon by low-energy nitrogen primary ion beams has been studied by a number of authors to characterize the altered layer, ripple formation and the sputtered yields of secondary ions [Surf. Sci. 424 (1999) 299; Appl. Phys. A: Mater. Sci. Process 53 (1991) 179; Appl. Phys. Lett. 73 (1998) 1287]. This study examines the application of low-energy nitrogen primary ion beams for the possible depth profiling of ultra-shallow arsenic implants into silicon. The emphasis of this work is on the matrix silicon signals in the pre-equilibrium surface region that are used for dose calibration. Problems with these aspects of the concentration depth profiling can give significant inconsistencies well outside the error limits of the quoted dose for the arsenic implantation as independently verified by CV profiling. This occurs during depth profiling with either oxygen primary ion beams (with and without oxygen leaks) or cesium primary ion beams

  9. Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon

    International Nuclear Information System (INIS)

    Gillen, Greg; Batteas, James; Michaels, Chris A.; Chi, Peter; Small, John; Windsor, Eric; Fahey, Albert; Verkouteren, Jennifer; Kim, K.J.

    2006-01-01

    A C 60 + primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an emphasis on possible application of C 60 + depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials. Unexpectedly, C 60 + SIMS depth profiling of silicon was found to be complicated by the deposition of an amorphous carbon layer which buries the silicon substrate. Sputtering of the silicon was observed only at the highest accessible beam energies (14.5 keV impact) or by using oxygen backfilling. C 60 + SIMS depth profiling of As delta-doped test samples at 14.5 keV demonstrated a substantial (factor of 5) degradation in depth resolution compared to Cs + SIMS depth profiling. This degradation is thought to result from the formation of an unusual platelet-like grain structure on the SIMS crater bottoms. Other unusual topographical features were also observed on silicon substrates after high primary ion dose C 60 + bombardment

  10. Tritium depth profiling by AMS in carbon samples from fusion experiments

    International Nuclear Information System (INIS)

    Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.

    2001-01-01

    Tritium depth profiling measurements by accelerator mass spectrometry have been performed at a facility installed at the Rossendorf 3 MV Tandetron. In order to achieve an uniform erosion at the target surface inside of a commercial Cs ion sputtering source and to avoid edge effects, the samples were mechanically scanned inside of a commercial Cs sputter ion source. The sputtered negative ions were mass analysed by the injection magnet of the Tandetron. The tritium ions are counted after the acceleration with semiconductor detectors. Depth profiles have been measured for carbon samples which had been exposed to the plasma at the first wall of the Garching fusion experiment ASDEX-Upgrade and from the European fusion experiment JET, Culham/UK. A dedicated AMS facility with an air-insulated 100 kV tandem accelerator for depth profiling measurements at samples with high tritium concentration is under construction. First results of test operation are presented. (orig.)

  11. Quantitative operando visualization of the energy band depth profile in solar cells.

    Science.gov (United States)

    Chen, Qi; Mao, Lin; Li, Yaowen; Kong, Tao; Wu, Na; Ma, Changqi; Bai, Sai; Jin, Yizheng; Wu, Dan; Lu, Wei; Wang, Bing; Chen, Liwei

    2015-07-13

    The energy band alignment in solar cell devices is critically important because it largely governs elementary photovoltaic processes, such as the generation, separation, transport, recombination and collection of charge carriers. Despite the expenditure of considerable effort, the measurement of energy band depth profiles across multiple layers has been extremely challenging, especially for operando devices. Here we present direct visualization of the surface potential depth profile over the cross-sections of operando organic photovoltaic devices using scanning Kelvin probe microscopy. The convolution effect due to finite tip size and cantilever beam crosstalk has previously prohibited quantitative interpretation of scanning Kelvin probe microscopy-measured surface potential depth profiles. We develop a bias voltage-compensation method to address this critical problem and obtain quantitatively accurate measurements of the open-circuit voltage, built-in potential and electrode potential difference.

  12. A new look at the steel cord-rubber adhesive interphase by chemical depth profiling

    International Nuclear Information System (INIS)

    Hammer, G.E.

    2001-01-01

    The adhesive interphase formed between brass plated steel cord and sulfur crosslinked rubber is known to be a complex layer of metal oxides, sulfides, and rubber. Hostile aging of this system produces changes in the structure, morphology, thickness, and mechanical properties of this layer. In a previous publication it has been shown that the overall thickness of the sulfide layer as measured by depth profiling with Auger electron spectroscopy could be used to characterize the degradation of the adhesive bond [G. E. Hammer et al., J. Vac. Sci. Technol. A 12, 2388 (1994)]. In this work multivariate statistical analysis of the sulfur Auger electron spectra was used to produce chemical depth profiles of the individual copper and zinc sulfide layers. These chemical depth profiles give new insight into the adhesion degradation mechanism on the nanometer scale. Particularly, the percentage of copper sulfide in the layer was found to be an accurate predictor of adhesion degradation

  13. Statistically sound evaluation of trace element depth profiles by ion beam analysis

    International Nuclear Information System (INIS)

    Schmid, K.; Toussaint, U. von

    2012-01-01

    This paper presents the underlying physics and statistical models that are used in the newly developed program NRADC for fully automated deconvolution of trace level impurity depth profiles from ion beam data. The program applies Bayesian statistics to find the most probable depth profile given ion beam data measured at different energies and angles for a single sample. Limiting the analysis to % level amounts of material allows one to linearize the forward calculation of ion beam data which greatly improves the computation speed. This allows for the first time to apply the maximum likelihood approach to both the fitting of the experimental data and the determination of confidence intervals of the depth profiles for real world applications. The different steps during the automated deconvolution will be exemplified by applying the program to artificial and real experimental data.

  14. Thermal Depth Profiling Reconstruction by Multilayer Thermal Quadrupole Modeling and Particle Swarm Optimization

    International Nuclear Information System (INIS)

    Zhao-Jiang, Chen; Shu-Yi, Zhang

    2010-01-01

    A new hybrid inversion method for depth profiling reconstruction of thermal conductivities of inhomogeneous solids is proposed based on multilayer quadrupole formalism of thermal waves, particle swarm optimization and sequential quadratic programming. The reconstruction simulations for several thermal conductivity profiles are performed to evaluate the applicability of the method. The numerical simulations demonstrate that the precision and insensitivity to noise of the inversion method are very satisfactory. (condensed matter: structure, mechanical and thermal properties)

  15. Accurate depth profiling for ultra-shallow implants using backside-SIMS

    International Nuclear Information System (INIS)

    Hongo, Chie; Tomita, Mitsuhiro; Takenaka, Miyuki

    2004-01-01

    We studied methods for accurate depth profiling for ultra-shallow implants using backside-SIMS. For the measurement of ultra-shallow profiles, the effects of surface transient and atomic mixing are not negligible. Therefore, we applied backside-SIMS to analyze ultra-shallow doping in order to exclude these effects. Backside-SIMS profiles show a sharper ion implantation tail than surface-side-SIMS profiles. In addition, the primary ion energy dependence becomes weaker when backside-SIMS is used [Surf. Interf. Anal. 29 (2000) 362; Appl. Surf. Sci. 203-204 (2003) 264; J. Vac. Sci. Technol. B 21 (2003) 1422]. However, the peak concentration of the backside sample was lower than that of the surface-side sample. Therefore, the sample flatness was estimated using the SIMS response function. Furthermore, SIMS profiles were simulated using SIMS response functions. This simulation shows how the sample flatness affects the SIMS profile

  16. Nondestructive strain depth profiling with high energy X-ray diffraction: System capabilities and limitations

    Science.gov (United States)

    Zhang, Zhan; Wendt, Scott; Cosentino, Nicholas; Bond, Leonard J.

    2018-04-01

    Limited by photon energy, and penetration capability, traditional X-ray diffraction (XRD) strain measurements are only capable of achieving a few microns depth due to the use of copper (Cu Kα1) or molybdenum (Mo Kα1) characteristic radiation. For deeper strain depth profiling, destructive methods are commonly necessary to access layers of interest by removing material. To investigate deeper depth profiles nondestructively, a laboratory bench-top high-energy X-ray diffraction (HEXRD) system was previously developed. This HEXRD method uses an industrial 320 kVp X-Ray tube and the Kα1 characteristic peak of tungsten, to produces a higher intensity X-ray beam which enables depth profiling measurement of lattice strain. An aluminum sample was investigated with deformation/load provided using a bending rig. It was shown that the HEXRD method is capable of strain depth profiling to 2.5 mm. The method was validated using an aluminum sample where both the HEXRD method and the traditional X-ray diffraction method gave data compared with that obtained using destructive etching layer removal, performed by a commercial provider. The results demonstrate comparable accuracy up to 0.8 mm depth. Nevertheless, higher attenuation capabilities in heavier metals limit the applications in other materials. Simulations predict that HEXRD works for steel and nickel in material up to 200 µm, but experiment results indicate that the HEXRD strain profile is not practical for steel and nickel material, and the measured diffraction signals are undetectable when compared to the noise.

  17. A technique for determining the depth distribution of cavities in He+-irradiated nickel

    International Nuclear Information System (INIS)

    Fenske, G.; Das, S.K.; Kaminsky, M.

    1979-01-01

    The authors describe a technique for examining the depth distribution of the damage (i.e., dislocations, bubbles and voids) in 4 He + ion-irradiated nickel. One existing technique is to section the sample parallel to the direction of the incident beam and prepare thin foils suitable for TEM. This technique has been used only in a few instances because of the difficulty in sample preparation, but it has the advantage that the entire depth distribution of damage can be obtained from a single sample. The technique described by the present authors is a modification of this type of technique and allows one to observe the depth distribution of bubbles and of damage in very near surface regions (<0.2μm) with excellent depth resolution and a small (approximately 50 A) uncertainty in locating the irradiated surface. (Auth.)

  18. Ion-beam-induced topography and compositional changes in depth profiling

    International Nuclear Information System (INIS)

    Carter, G.; Nobes, M.J.

    1992-01-01

    When energetic ions penetrate and stop in solids they not only add a new atomic constituent to the matrix but they also create atomic recoils and defects. The fluxes of these entities can give rise to spatial redistribution of atomic components, which may be partly or completely balanced by reordering and relaxation processes. These latter, in turn, may be influenced by fields and gradients induced by the primary relocation processes and by the energy deposited. These will include quasi-thermal, concentration (or chemical potential) and electrostatic gradients and may act to enhance or suppress atomic redistribution. Some, or all, of these processes will operate, depending upon the system under study, when energetic ions are employed to sputter erode a substrate for depth sectioning and, quite generally, can perturb the atomic depth profile that it is intended to evaluate. Theoretical and computational approaches to modelling such processes will be outlined and experimental examples shown which illustrate specific phenomena. In particular the accumulation of implant species and defect generation or redistribution can modify, with increasing ion fluence, the local sputtering mechanism and create further problems in depth profile analysis as a changing surface topography penetrates the solid. Examples of such topographic evolution and its influence on depth profiling analysis will be given and models to explain general and specific behaviour will be outlined. The commonality of models which examine both depth-dependent composition modification and surface topography evolution will be stressed. (author)

  19. Depth profiles of H and O in thin films of a-Si:H

    International Nuclear Information System (INIS)

    Sie, S.H.; Ryan, C.J.

    1985-01-01

    Detailed depth profiles of hydrogen and oxygen were measured, in thin film samples of a-Si:H produced under varying conditions, using the reaction 1 H( 19 F,α γ) 16 O in the vicinity of the resonance at E( 19 F) = 6.417 MeV to profile hydrogen, and resonant elastic α scattering near the resonance at Eα = 3.0359 MeV to profile oxygen. Contrasting results reflecting the different fabrication conditions were obtained and these were correlated with the measured electrical properties

  20. Deconvolution of charged particle spectra from neutron depth profiling using Simplex method

    Czech Academy of Sciences Publication Activity Database

    Hnatowicz, Vladimír; Vacík, Jiří; Fink, Dietmar

    2010-01-01

    Roč. 81, č. 7 (2010), 073906/1-073906/7 ISSN 0034-6748 R&D Projects: GA MŠk(CZ) LC06041 Institutional research plan: CEZ:AV0Z10480505 Keywords : neutron depth profiling * Simplex method * NDP Subject RIV: BG - Nuclear , Atomic and Molecular Physics, Colliders Impact factor: 1.598, year: 2010

  1. The impact of molecular emission in compositional depth profiling using Glow Discharge-Optical Emission Spectroscopy

    International Nuclear Information System (INIS)

    Bengtson, Arne

    2008-01-01

    The scope of this paper is to investigate and discuss how molecular emission can affect elemental analysis in glow discharge optical emission (GD-OES), particularly in compositional depth profiling (CDP) applications. Older work on molecular emission in glow discharges is briefly reviewed, and the nature of molecular emission spectra described. Work on the influence of hydrogen in the plasma, in particular elevated background due to a continuum spectrum, is discussed. More recent work from sputtering of polymers and other materials with a large content of light elements in a Grimm type source is reviewed, where substantial emission has been observed from several light diatomic molecules (CO, CH, OH, NH, C 2 ). It is discussed how the elevated backgrounds from such molecular emission can lead to significant analytical errors in the form of 'false' depth profile signals of several atomic analytical lines. Results from a recent investigation of molecular emission spectra from mixed gases in a Grimm type glow discharge are presented. An important observation is that dissociation and subsequent recombination processes occur, leading to formation of molecular species not present in the original plasma gas. Experimental work on depth profiling of a polymer coating and a thin silicate film, using a spectrometer equipped with channels for molecular emission lines, is presented. The results confirm that molecular emission gives rise to apparent depth profiles of elements not present in the sample. The possibilities to make adequate corrections for such molecular emission in CDP of organic coatings and very thin films are discussed

  2. In situ neutron depth profiling: A powerful method to probe lithium transport in micro-batteries

    NARCIS (Netherlands)

    Oudenhoven, J.F.M.; Labohm, F.; Mulder, M.; Niessen, R.A.H.; Mulder, F.M.; Notten, P.H.L.

    2011-01-01

    In situ neutron depth profiling (NDP) offers the possibility to observe lithium transport inside micro-batteries during battery operation. It is demonstrated that NDP results are consistent with the results of electrochemical measurements, and that the use of an enriched6LiCoO2 cathode offers more

  3. Characterization of polymer solar cells by TOF-SIMS depth profiling

    NARCIS (Netherlands)

    Bulle-Lieuwma, C.W.T.; Gennip, van W.J.H.; Duren, van J.K.J.; Jonkheijm, P.; Janssen, R.A.J.; Niemantsverdriet, J.W.

    2003-01-01

    Solar cells consisting of polymer layers sandwiched between a transparent electrode on glass and a metal top electrode are studied using dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS) in dual-beam mode. Because depth profiling of polymers and polymer-metal stacks is a relatively

  4. Quantitative depth profiling of K-doped fullerene films using XPS and SIMS

    Czech Academy of Sciences Publication Activity Database

    Oswald, S.; Janda, Pavel; Dunsch, L.

    2003-01-01

    Roč. 141, 1-2 (2003), s. 79-85 E-ISSN 1436-5073 Institutional research plan: CEZ:AV0Z4040901 Keywords : XPS * SIMS * depth profiling * fullerenes * doping Subject RIV: CG - Electrochemistry Impact factor: 0.784, year: 2003

  5. Auger and depth profile analysis of synthetic crystals for dispersion of soft x-rays

    International Nuclear Information System (INIS)

    Rachocki, K.D.; Brown, D.R.; Springer, R.W.; Arendt, P.N.

    1983-01-01

    Numerous samples have been fabricated and analyzed as part of a program to produce soft x-ray dispersion elements for various laboratory applications. The majority of this work has centered around the carbon/tungsten system, although several other low-Z/high-Z pairs have been investigated. This report describes the development of certain vacuum-deposition techniques for fabricating these dispersion elements, based upon results obtained from x-ray reflectivity measurements and Auger depth-profile analysis. The composition of the films is chiefly alternating layers of tungsten carbide and carbon. Excess carbon is introduced during the deposition of the tungsten to ensure that the carbide layer is fully stoichiometric. Layer thickness ranged from approx. 5 to 30 A for the carbide and from approx. 15 to 80 A for the carbon. The reflectivity measurements were made using Fe and Al K/sub α/ at grazing incidence. The emphasis in these studies is on the application of surface-analysis results in suggesting modifications to the fabrication process and in evaluating the results such modifications have on the layer stoichiometry, continuity, and periodicity of the dispersion elements so produced

  6. Long-range depth profiling of camouflaged targets using single-photon detection

    Science.gov (United States)

    Tobin, Rachael; Halimi, Abderrahim; McCarthy, Aongus; Ren, Ximing; McEwan, Kenneth J.; McLaughlin, Stephen; Buller, Gerald S.

    2018-03-01

    We investigate the reconstruction of depth and intensity profiles from data acquired using a custom-designed time-of-flight scanning transceiver based on the time-correlated single-photon counting technique. The system had an operational wavelength of 1550 nm and used a Peltier-cooled InGaAs/InP single-photon avalanche diode detector. Measurements were made of human figures, in plain view and obscured by camouflage netting, from a stand-off distance of 230 m in daylight using only submilliwatt average optical powers. These measurements were analyzed using a pixelwise cross correlation approach and compared to analysis using a bespoke algorithm designed for the restoration of multilayered three-dimensional light detection and ranging images. This algorithm is based on the optimization of a convex cost function composed of a data fidelity term and regularization terms, and the results obtained show that it achieves significant improvements in image quality for multidepth scenarios and for reduced acquisition times.

  7. Centennial- to millennial-scale hard rock erosion rates deduced from luminescence-depth profiles

    DEFF Research Database (Denmark)

    Sohbati, Reza; Liu, Jinfeng; Jain, Mayank

    2018-01-01

    to quantify hard rock erosion rates at centennial to millennial timescales. Here we propose a novel technique, based on the solar bleaching of luminescence signals with depth into rock surfaces, to bridge this analytical gap. We apply our technique to glacial and landslide boulders in the Eastern Pamirs...

  8. Ion implantation artifacts observed in depth profiling boron in silicon by secondary ion mass spectrometry

    International Nuclear Information System (INIS)

    Chi, P.; Simons, D.S.

    1987-01-01

    A comparison study of depth profiling by secondary ion mass spectrometry (SIMS) and neutron depth profiling (NDP) was recently conducted. The specimens were portions of 5 cm diameter single crystal silicon slices in which B-10 had been implanted at various fluences and energies. NDP measurements were made on a 13 mm diameter area at the center of the wafers. SIMS measurements were taken from a 60 μm diameter area approximately 16 mm from the center of the wafer. One observation that emerged from this work was an apparent discrepancy between the profiles of B-10 measured by DNP and SIMS. The peaks of the SIMS profiles were typically deeper than those of NDP by as much as 30 nm, which is 10% of the projected range for a 70 keV implant. Moreover, the profiles could not be made to coincide by either a constant shift or a proportional change of one depth scale with respect to the other. The lateral inhomogeneity of boron that these experiments have demonstrated arises from the variable contribution of ion channeling during implantation

  9. Investigation of the depth profile of ion beam induced nanopatterns on Si with simultaneous metal incorporation

    Energy Technology Data Exchange (ETDEWEB)

    Khanbabaee, Behnam; Arezki, Bahia; Biermanns, Andreas; Pietsch, Ullrich [Festkoerperphysik, Universitaet Siegen, Siegen (Germany); Cornejo, Marina; Frost, Frank [Leibniz-Institut fuer Oberflaechenmodifizierung (IOM), Leipzig (Germany)

    2011-07-01

    Ion beam sputtering of semiconductor surfaces can modify the surface and produce a diversity of surface topographies such as periodic ripples or dot structures depended on sputtering parameters. Well ordered nanostructured surfaces have widely technological applications. Recent experiments have shown that the incorporation of metallic impurity atoms during the sputtering process plays a crucial role in pattern formation on the surfaces. These findings offer a new degree of freedom to control pattern formation. In this contribution we report on surface patterning due to Kr ion beam erosion on silicon surfaces with simultaneous Fe and Cr incorporation. We used X-ray reflectivity (XRR) to determine the depth profiles of metal ions as function of ion beam divergence angles and the mean incidence angle of the ions with respect to the surface normal. Depth profiles are correlated with degree of pattern formation determined by AFM. We show that the mean penetration depth and concentration of metal ions depends on the divergence angle of Kr beam provided by Kaufman source which supports the assumption that metal ions are created due to parasitic interaction of the Kr beam with the steel plate lining. The evaluated depth profile by XRR is in good agreement with SIMS and RBS results.

  10. Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

    Energy Technology Data Exchange (ETDEWEB)

    Mahoney, Christine M. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)]. E-mail: christine.mahoney@nist.gov; Fahey, Albert J. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Gillen, Greg [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Xu Chang [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Batteas, James D. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)

    2006-07-30

    Secondary ion mass spectrometry (SIMS) employing an SF{sub 5} {sup +} polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from -125 deg. C to 150 deg. C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced interfacial widths as compared to analysis at ambient temperature. Atomic force microscopy (AFM) images indicated that this improvement in interfacial width may be related to a decrease in sputter-induced topography. Depth profiling at higher temperatures was typically correlated with increased sputter rates. However, the improvements in interfacial widths and overall secondary ion stability were not as prevalent as was observed at low temperature. For PLA, improvements in signal intensities were observed at low temperatures, yet there was no significant change in secondary ion stability, interface widths or sputter rates. High temperatures yielded a significant decrease in secondary ion stability of the resulting profiles. PS films showed rapid degradation of characteristic secondary ion signals under all temperatures examined.

  11. A technique using a stellar spectrographic plate to measure terrestrial ozone column depth

    Energy Technology Data Exchange (ETDEWEB)

    Wong, Alec Y. [Univ. of California, Berkeley, CA (United States)

    1995-08-01

    This thesis examines the feasibility of a technique to extract ozone column depths from photographic stellar spectra in the 5000--7000 Angstrom spectral region. A stellar spectrographic plate is measured to yield the relative intensity distribution of a star`s radiation after transmission through the earth`s atmosphere. The amount of stellar radiation absorbed by the ozone Chappuis band is proportional to the ozone column depth. The measured column depth is within 10% the mean monthly value for latitude 36{degree}N, however the uncertainty is too large to make the measurement useful. This thesis shows that a 10% improvement to the photographic sensitivity uncertainty can decrease the column depth uncertainty to a level acceptable for climatic study use. This technique offers the possibility of measuring past ozone column depths.

  12. Estimating cumulative soil accumulation rates with in situ-produced cosmogenic nuclide depth profiles

    International Nuclear Information System (INIS)

    Phillips, William M.

    2000-01-01

    A numerical model relating spatially averaged rates of cumulative soil accumulation and hillslope erosion to cosmogenic nuclide distribution in depth profiles is presented. Model predictions are compared with cosmogenic 21 Ne and AMS radiocarbon data from soils of the Pajarito Plateau, New Mexico. Rates of soil accumulation and hillslope erosion estimated by cosmogenic 21 Ne are significantly lower than rates indicated by radiocarbon and regional soil-geomorphic studies. The low apparent cosmogenic erosion rates are artifacts of high nuclide inheritance in cumulative soil parent material produced from erosion of old soils on hillslopes. In addition, 21 Ne profiles produced under conditions of rapid accumulation (>0.1 cm/a) are difficult to distinguish from bioturbated soil profiles. Modeling indicates that while 10 Be profiles will share this problem, both bioturbation and anomalous inheritance can be identified with measurement of in situ-produced 14 C

  13. Comparison of L-curve and LOOCV depth profiles from TAARXPS data

    Energy Technology Data Exchange (ETDEWEB)

    Paynter, R.W., E-mail: royston_paynter@emt.inrs.ca

    2017-01-15

    Highlights: • Regularized profiles were extracted from TAARXPS data. • The L-curve and LOO cross-validation were used to choose the regularization parameter. • The two parameter choice methods were compared. - Abstract: Time and angle resolved X-ray photoelectron spectroscopy (TAARXPS) data, obtained from polystyrene samples exposed to an oxygen/helium plasma, have been interpreted using 1st order Tikhonov regularization to smooth the extracted depth profiles. Two methods for the choice of the regularization parameter, namely the L-curve method and leave-one-out cross-validation (LOOCV), are compared and contrasted.

  14. Characterizing contaminant concentrations with depth by using the USGS well profiler in Oklahoma, 2003-9

    Science.gov (United States)

    Smith, S. Jerrod; Becker, Carol J.

    2011-01-01

    Since 2003, the U.S. Geological Survey (USGS) Oklahoma Water Science Center has been using the USGS well profiler to characterize changes in water contribution and contaminant concentrations with depth in pumping public-supply wells in selected aquifers. The tools and methods associated with the well profiler, which were first developed by the USGS California Water Science Center, have been used to investigate common problems such as saline water intrusion in high-yield irrigation wells and metals contamination in high-yield public-supply wells.

  15. Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered Neutrals

    Science.gov (United States)

    Willingham, D.; Brenes, D. A.; Winograd, N.; Wucher, A.

    2010-01-01

    Molecular depth profiles of model organic thin films were performed using a 40 keV C60+ cluster ion source in concert with TOF-SIMS. Strong-field photoionization of intact neutral molecules sputtered by 40 keV C60+ primary ions was used to analyze changes in the chemical environment of the guanine thin films as a function of ion fluence. Direct comparison of the secondary ion and neutral components of the molecular depth profiles yields valuable information about chemical damage accumulation as well as changes in the molecular ionization probability. An analytical protocol based on the erosion dynamics model is developed and evaluated using guanine and trehalose molecular secondary ion signals with and without comparable laser photoionization data. PMID:26269660

  16. Effects of Shear Fracture on In-depth Profile Modification of Weak Gels

    Institute of Scientific and Technical Information of China (English)

    Li Xianjie; Song Xinwang; Yue Xiang'an; Hou Jirui; Fang Lichun; Zhang Huazhen

    2007-01-01

    Two sand packs were filled with fine glass beads and quartz sand respectively. The characteristics of crosslinked polymer flowing through the sand packs as well as the influence of shear fracture of porous media on the in-depth profile modification of the weak gel generated from the crosslinked polymer were investigated. The results indicated that under the dynamic condition crosslinking reaction happened in both sand packs,and the weak gels in these two cases became small gel particles after water flooding. The differences were:the dynamic gelation time in the quartz sand pack was longer than that in the glass bead pack. Residual resistance factor (FRR) caused by the weak gel in the quartz sand pack was smaller than that in the glass bead pack. The weak gel became gel particles after being scoured by subsequent flood water. A weak gel with uniform apparent viscosity and sealing characteristics was generated in every part of the glass bead pack,which could not only move deeply into the sand pack but also seal the high capacity channels again when it reached the deep part. The weak gel performed in-depth profile modification in the glass bead pack,while in the quartz sand pack,the weak gel was concentrated with 100 cm from the entrance of the sand pack. When propelled by the subsequent flood water,the weak gel could move towards the deep part of the sand pack but then became tiny gel particles and could not effectively seal the high capacity channels there. The in-depth profile modification of the weak gel was very weak in the quartz sand pack. It was the shear fracture of porous media that mainly affected the properties and weakened the in-depth profile modification of the weak gel.

  17. The impact of molecular emission in compositional depth profiling using Glow Discharge-Optical Emission Spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Bengtson, Arne [Corrosion and Metals Research Institute, Dr. Kristinas vaeg 48, Stockholm (Sweden)], E-mail: arne.bengtson@kimab.com

    2008-09-15

    The scope of this paper is to investigate and discuss how molecular emission can affect elemental analysis in glow discharge optical emission (GD-OES), particularly in compositional depth profiling (CDP) applications. Older work on molecular emission in glow discharges is briefly reviewed, and the nature of molecular emission spectra described. Work on the influence of hydrogen in the plasma, in particular elevated background due to a continuum spectrum, is discussed. More recent work from sputtering of polymers and other materials with a large content of light elements in a Grimm type source is reviewed, where substantial emission has been observed from several light diatomic molecules (CO, CH, OH, NH, C{sub 2}). It is discussed how the elevated backgrounds from such molecular emission can lead to significant analytical errors in the form of 'false' depth profile signals of several atomic analytical lines. Results from a recent investigation of molecular emission spectra from mixed gases in a Grimm type glow discharge are presented. An important observation is that dissociation and subsequent recombination processes occur, leading to formation of molecular species not present in the original plasma gas. Experimental work on depth profiling of a polymer coating and a thin silicate film, using a spectrometer equipped with channels for molecular emission lines, is presented. The results confirm that molecular emission gives rise to apparent depth profiles of elements not present in the sample. The possibilities to make adequate corrections for such molecular emission in CDP of organic coatings and very thin films are discussed.

  18. Surface analysis and depth profiling of corrosion products formed in lead pipes used to supply low alkalinity drinking water.

    Science.gov (United States)

    Davidson, C M; Peters, N J; Britton, A; Brady, L; Gardiner, P H E; Lewis, B D

    2004-01-01

    Modern analytical techniques have been applied to investigate the nature of lead pipe corrosion products formed in pH adjusted, orthophosphate-treated, low alkalinity water, under supply conditions. Depth profiling and surface analysis have been carried out on pipe samples obtained from the water distribution system in Glasgow, Scotland, UK. X-ray diffraction spectrometry identified basic lead carbonate, lead oxide and lead phosphate as the principal components. Scanning electron microscopy/energy-dispersive x-ray spectrometry revealed the crystalline structure within the corrosion product and also showed spatial correlations existed between calcium, iron, lead, oxygen and phosphorus. Elemental profiling, conducted by means of secondary ion mass spectrometry (SIMS) and secondary neutrals mass spectrometry (SNMS) indicated that the corrosion product was not uniform with depth. However, no clear stratification was apparent. Indeed, counts obtained for carbonate, phosphate and oxide were well correlated within the depth range probed by SIMS. SNMS showed relationships existed between carbon, calcium, iron, and phosphorus within the bulk of the scale, as well as at the surface. SIMS imaging confirmed the relationship between calcium and lead and suggested there might also be an association between chloride and phosphorus.

  19. Depth profiling of {sup 14} N and {sup 20} Ne implantation into iron and steel using(p, gamma) reactions. Vol. 2

    Energy Technology Data Exchange (ETDEWEB)

    Wriekat, A; Haj-Abdellah, M [Physics Department, University of Jordan, Amman (Jordan)

    1996-03-01

    Depth profiles of {sup 14} N and {sup 20} Ne ions at 800 KeV implanted into iron and by steel samples have been measured by means of the proton induced {gamma}- ray emission (Pige) technique. The range, R, and range straggling, {Delta}R for these profiles were obtained and compared with theoretical calculations. The experimental results did show that pure iron retains more N and Ne than steel. 2 figs., 1 tab.

  20. Depth Profiles in Maize ( Zea mays L.) Seeds Studied by Photoacoustic Spectroscopy

    Science.gov (United States)

    Hernández-Aguilar, C.; Domínguez-Pacheco, A.; Cruz-Orea, A.; Zepeda-Bautista, R.

    2015-06-01

    Photoacoustic spectroscopy (PAS) has been used to analyze agricultural seeds and can be applied to the study of seed depth profiles of these complex samples composed of different structures. The sample depth profile can be obtained through the photoacoustic (PA) signal, amplitude, and phase at different light modulation frequencies. The PA signal phase is more sensitive to changes of thermal properties in layered samples than the PA signal amplitude. Hence, the PA signal phase can also be used to characterize layers at different depths. Thus, the objective of the present study was to obtain the optical absorption spectra of maize seeds ( Zea mays L.) by means of PAS at different light modulation frequencies (17 Hz, 30 Hz, and 50 Hz) and comparing these spectra with the ones obtained from the phase-resolved method in order to separate the optical absorption spectra of seed pericarp and endosperm. The results suggest the possibility of using the phase-resolved method to obtain optical absorption spectra of different seed structures, at different depths, without damaging the seed. Thus, PAS could be a nondestructive method for characterization of agricultural seeds and thus improve quality control in the food industry.

  1. A comparison of mixing depths observed by ground-based wind profilers and an airborne lidar

    Energy Technology Data Exchange (ETDEWEB)

    White, A.B.; Senff, C. [Univ. of Colorado/NOAA Environmental Technology Lab., Cooperative Inst. for Research in Environmental Sciences, Boulder, CO (United States); Banta, R.M. [NOAA Environmental Technology Lab., Boulder, CO (United States)

    1997-10-01

    The mixing depth is one of the most important parameters in air pollution studies because it determines the vertical extent of the `box` in which pollutants are mixed and dispersed. During the 1995 Southern Oxidants Study (SOS95), scientists from the National Oceanic and Atmospheric Administration Environmental Technology Laboratory (NOAA/ETL) deployed four 915-MHz boundary-layer radar/wind profilers (hereafter radars) in and around the Nashville, Tennessee metropolitan area. Scientists from NOAA/ETL also operated an ultraviolet differential absorption lidar (DIAL) onboard a CASA-212 aircraft. Profiles from radar and DIAL can be used to derive estimates of the mixing depth. The methods used for both instruments are similar in that they depend on information derived from the backscattered power. However, different scattering mechanisms for the radar and DIAL mean that different tracers of mixing depth are measured. In this paper we compare the mixing depth estimates obtained from the radar and DIAL and discuss the similarities and differences that occur. (au)

  2. Novel approach of signal normalization for depth profile of cultural heritage materials

    Science.gov (United States)

    Syvilay, D.; Detalle, V.; Wilkie-Chancellier, N.; Texier, A.; Martinez, L.; Serfaty, S.

    2017-01-01

    The investigation of cultural heritage materials is always complex and specific because unique. Materials are most often heterogeneous and organized in several layers such as mural paintings or corrosion products. The characterization of a complete artwork's stratigraphy is actually one of the questions of science conservation. Indeed, the knowledge of these layers allows completing the history of the work of art and a better understanding of alteration processes in order to set up an appropriate conservation action. The LIBS technique has been employed to study the stratigraphy of an artwork thanks to the ablation laser. However, as we know, atomic information could be insufficient to characterize two materials composed by the same based elements. Therefore, an additional molecular analysis, like Raman spectroscopy; is sometimes necessary for a better identification of the material in particular for organic coatings in cultural heritage. We suggest in this study to use Standard Normal Variate (SNV) as a common normalization for different kinds of spectra (LIBS and Raman spectroscopy) combined with a 3D colour representation for stratigraphic identification of the different layers composing the complex material from artwork. So in this investigation, the SNV method will be applied on LIBS and Raman spectra but also on baseline Raman spectra often considering as nuisance. The aim of this study is to demonstrate the versatility of SNV applied on varied spectra like LIBS, Raman spectra as well as the luminescence background. This original work considers the SNV with a 3D colour representation as a probable new perspective for an easy recognition of a structure layered with a direct overview of the depth profile of the artwork.

  3. Analyses of hydrogen in quartz and in sapphire using depth profiling by ERDA at atmospheric pressure: Comparison with resonant NRA and SIMS

    International Nuclear Information System (INIS)

    Reiche, Ina; Castaing, Jacques; Calligaro, Thomas; Salomon, Joseph; Aucouturier, Marc; Reinholz, Uwe; Weise, Hans-Peter

    2006-01-01

    Hydrogen is present in anhydrous materials as a result of their synthesis and of their environment during conservation. IBA provides techniques to measure H concentration depth profiles allowing to identify various aspects of the materials including the history of objects such as gemstones used in cultural heritage. A newly established ERDA set-up, using an external microbeam of alpha particles, has been developed to study hydrated near-surface layers in quartz and sapphire by non-destructive H depth profiling in different atmospheres. The samples were also analysed using resonant NRA and SIMS

  4. Interdiffusion in epitaxial, single-crystalline Au/Ag thin films studied by Auger electron spectroscopy sputter-depth profiling and positron annihilation

    International Nuclear Information System (INIS)

    Noah, Martin A.; Flötotto, David; Wang, Zumin; Reiner, Markus; Hugenschmidt, Christoph; Mittemeijer, Eric J.

    2016-01-01

    Interdiffusion in epitaxial, single-crystalline Au/Ag bilayered thin films on Si (001) substrates was investigated by Auger electron spectroscopy (AES) sputter-depth profiling and by in-situ positron annihilation Doppler broadening spectroscopy (DBS). By the combination of these techniques identification of the role of vacancy sources and sinks on interdiffusion in the Au/Ag films was possible. It was found that with precise knowledge of the concentration-dependent self-diffusion and impurity diffusion coefficients a distinction between the Darken-Manning treatment and Nernst-Planck treatment can be made, which is not possible on the basis of the determined concentration-depth profiles alone.

  5. Analyses of hydrogen in quartz and in sapphire using depth profiling by ERDA at atmospheric pressure: Comparison with resonant NRA and SIMS

    Energy Technology Data Exchange (ETDEWEB)

    Reiche, Ina [Laboratoire du Centre de recherche et de restauration des musees de France (C2RMF), UMR 171 CNRS, 14 quai Francois Mitterrand, 75001 Paris (France); Castaing, Jacques [Laboratoire du Centre de recherche et de restauration des musees de France (C2RMF), UMR 171 CNRS, 14 quai Francois Mitterrand, 75001 Paris (France)]. E-mail: jacques.castaing@culture.fr; Calligaro, Thomas [Laboratoire du Centre de recherche et de restauration des musees de France (C2RMF), UMR 171 CNRS, 14 quai Francois Mitterrand, 75001 Paris (France); Salomon, Joseph [Laboratoire du Centre de recherche et de restauration des musees de France (C2RMF), UMR 171 CNRS, 14 quai Francois Mitterrand, 75001 Paris (France); Aucouturier, Marc [Laboratoire du Centre de recherche et de restauration des musees de France (C2RMF), UMR 171 CNRS, 14 quai Francois Mitterrand, 75001 Paris (France); Reinholz, Uwe [Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin (Germany); Weise, Hans-Peter [Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin (Germany)

    2006-08-15

    Hydrogen is present in anhydrous materials as a result of their synthesis and of their environment during conservation. IBA provides techniques to measure H concentration depth profiles allowing to identify various aspects of the materials including the history of objects such as gemstones used in cultural heritage. A newly established ERDA set-up, using an external microbeam of alpha particles, has been developed to study hydrated near-surface layers in quartz and sapphire by non-destructive H depth profiling in different atmospheres. The samples were also analysed using resonant NRA and SIMS.

  6. Compositional depth profiles of the type 316 stainless steel undergone the corrosion in liquid lithium using laser-induced breakdown spectroscopy

    Science.gov (United States)

    Li, Ying; Ke, Chuan; Liu, Xiang; Gou, Fujun; Duan, Xuru; Zhao, Yong

    2017-12-01

    Liquid metal lithium cause severe corrosion on the surface of metal structure material that used in the blanket and first wall of fusion device. Fast and accurate compositional depth profile measurement for the boundary layer of the corroded specimen will reveal the clues for the understanding and evaluation of the liquid lithium corrosion process as well as the involved corrosion mechanism. In this work, the feasibility of laser-induced breakdown spectroscopy for the compositional depth profile analysis of type 316 stainless steel which was corroded by liquid lithium in certain conditions was demonstrated. High sensitivity of LIBS was revealed especially for the corrosion medium Li in addition to the matrix elements of Fe, Cr, Ni and Mn by the spectral analysis of the plasma emission. Compositional depth profile analysis for the concerned elements which related to corrosion was carried out on the surface of the corroded specimen. Based on the verified local thermodynamic equilibrium shot-by-shot along the depth profile, the matrix effect was evaluated as negligible by the extracted physical parameter of the plasmas generated by each laser pulse in the longitudinal depth profile. In addition, the emission line intensity ratios were introduced to further reduce the impact on the emission line intensity variations arise from the strong inhomogeneities on the corroded surface. Compositional depth profiles for the matrix elements of Fe, Cr, Ni, Mn and the corrosion medium Li were constructed with their measured relative emission line intensities. The distribution and correlations of the concerned elements in depth profile may indicate the clues to the complicated process of composition diffusion and mass transfer. The results obtained demonstrate the potentiality of LIBS as an effective technique to perform spectrochemical measurement in the research fields of liquid metal lithium corrosion.

  7. Nuclear method for determination of nitrogen depth distributions in single seeds. [/sup 14/N tracer technique

    Energy Technology Data Exchange (ETDEWEB)

    Sundqvist, B; Gonczi, L; Koersner, I; Bergman, R; Lindh, U

    1974-01-01

    (d,p) reactions in /sup 14/N were used for probing single kernels of seed for nitrogen content and nitrogen depth distributions. Comparison with the Kjeldahl method was made on individual peas and beans. The results were found to be strongly correlated. The technique to obtain depth distributions of nitrogen was also used on high- and low-lysine varieties of barley for which large differences in nitrogen distributions were found.

  8. The effect of particle properties on the depth profile of buoyant plastics in the ocean

    Science.gov (United States)

    Kooi, Merel; Reisser, Julia; Slat, Boyan; Ferrari, Francesco F.; Schmid, Moritz S.; Cunsolo, Serena; Brambini, Roberto; Noble, Kimberly; Sirks, Lys-Anne; Linders, Theo E. W.; Schoeneich-Argent, Rosanna I.; Koelmans, Albert A.

    2016-10-01

    Most studies on buoyant microplastics in the marine environment rely on sea surface sampling. Consequently, microplastic amounts can be underestimated, as turbulence leads to vertical mixing. Models that correct for vertical mixing are based on limited data. In this study we report measurements of the depth profile of buoyant microplastics in the North Atlantic subtropical gyre, from 0 to 5 m depth. Microplastics were separated into size classes (0.5-1.5 and 1.5-5.0 mm) and types (‘fragments’ and ‘lines’), and associated with a sea state. Microplastic concentrations decreased exponentially with depth, with both sea state and particle properties affecting the steepness of the decrease. Concentrations approached zero within 5 m depth, indicating that most buoyant microplastics are present on or near the surface. Plastic rise velocities were also measured, and were found to differ significantly for different sizes and shapes. Our results suggest that (1) surface samplers such as manta trawls underestimate total buoyant microplastic amounts by a factor of 1.04-30.0 and (2) estimations of depth-integrated buoyant plastic concentrations should be done across different particle sizes and types. Our findings can assist with improving buoyant ocean plastic vertical mixing models, mass balance exercises, impact assessments and mitigation strategies.

  9. Hemispheric aerosol vertical profiles: anthropogenic impacts on optical depth and cloud nuclei.

    Science.gov (United States)

    Clarke, Antony; Kapustin, Vladimir

    2010-09-17

    Understanding the effect of anthropogenic combustion upon aerosol optical depth (AOD), clouds, and their radiative forcing requires regionally representative aerosol profiles. In this work, we examine more than 1000 vertical profiles from 11 major airborne campaigns in the Pacific hemisphere and confirm that regional enhancements in aerosol light scattering, mass, and number are associated with carbon monoxide from combustion and can exceed values in unperturbed regions by more than one order of magnitude. Related regional increases in a proxy for cloud condensation nuclei (CCN) and AOD imply that direct and indirect aerosol radiative effects are coupled issues linked globally to aged combustion. These profiles constrain the influence of combustion on regional AOD and CCN suitable for challenging climate model performance and informing satellite retrievals.

  10. Depth extraction method with high accuracy in integral imaging based on moving array lenslet technique

    Science.gov (United States)

    Wang, Yao-yao; Zhang, Juan; Zhao, Xue-wei; Song, Li-pei; Zhang, Bo; Zhao, Xing

    2018-03-01

    In order to improve depth extraction accuracy, a method using moving array lenslet technique (MALT) in pickup stage is proposed, which can decrease the depth interval caused by pixelation. In this method, the lenslet array is moved along the horizontal and vertical directions simultaneously for N times in a pitch to get N sets of elemental images. Computational integral imaging reconstruction method for MALT is taken to obtain the slice images of the 3D scene, and the sum modulus (SMD) blur metric is taken on these slice images to achieve the depth information of the 3D scene. Simulation and optical experiments are carried out to verify the feasibility of this method.

  11. Quantitative considerations in medium energy ion scattering depth profiling analysis of nanolayers

    Energy Technology Data Exchange (ETDEWEB)

    Zalm, P.C.; Bailey, P. [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom); Reading, M.A. [Physics and Materials Research Centre, University of Salford, Salford M5 4WT (United Kingdom); Rossall, A.K. [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom); Berg, J.A. van den, E-mail: j.vandenberg@hud.ac.uk [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom)

    2016-11-15

    The high depth resolution capability of medium energy ion scattering (MEIS) is becoming increasingly relevant to the characterisation of nanolayers in e.g. microelectronics. In this paper we examine the attainable quantitative accuracy of MEIS depth profiling. Transparent but reliable analytical calculations are used to illustrate what can ultimately be achieved for dilute impurities in a silicon matrix and the significant element-dependence of the depth scale, for instance, is illustrated this way. Furthermore, the signal intensity-to-concentration conversion and its dependence on the depth of scattering is addressed. Notably, deviations from the Rutherford scattering cross section due to screening effects resulting in a non-coulombic interaction potential and the reduction of the yield owing to neutralization of the exiting, backscattered H{sup +} and He{sup +} projectiles are evaluated. The former mainly affects the scattering off heavy target atoms while the latter is most severe for scattering off light target atoms and can be less accurately predicted. However, a pragmatic approach employing an extensive data set of measured ion fractions for both H{sup +} and He{sup +} ions scattered off a range of surfaces, allows its parameterization. This has enabled the combination of both effects, which provides essential information regarding the yield dependence both on the projectile energy and the mass of the scattering atom. Although, absolute quantification, especially when using He{sup +}, may not always be achievable, relative quantification in which the sum of all species in a layer adds up to 100%, is generally possible. This conclusion is supported by the provision of some examples of MEIS derived depth profiles of nanolayers. Finally, the relative benefits of either using H{sup +} or He{sup +} ions are briefly considered.

  12. Acclimation to different depths by the marine angiosperm Posidonia oceanica: transcriptomic and proteomic profiles

    Directory of Open Access Journals (Sweden)

    Emanuela eDattolo

    2013-06-01

    Full Text Available For seagrasses, seasonal and daily variations in light and temperature represent the mains factors driving their distribution along the bathymetric cline. Changes in these environmental factors, due to climatic and anthropogenic effects, can compromise their survival. In a framework of conservation and restoration, it becomes crucial to improve our knowledge about the physiological plasticity of seagrass species along environmental gradients. Here, we aimed to identify differences in transcriptomic and proteomic profiles, involved in the acclimation along the depth gradient in the seagrass Posidonia oceanica, and to improve the available molecular resources in this species, which is an important requisite for the application of eco-genomic approaches. To do that, from plant growing in the shallow (-5m and a deep (-25m portions of a single meadow, (i we generated two reciprocal EST (Expressed Sequences Tags libraries using a Suppressive Subtractive Hybridization (SSH approach, to obtain depth/specific transcriptional profiles, and (ii we identified proteins differentially expressed, using the highly innovative USIS mass spectrometry methodology, coupled with 1D-SDS electrophoresis and labeling free approach. Mass spectra were searched in the open source Global Proteome Machine (GPM engine against plant databases and with the X!Tandem algorithm against a local database. Transcriptional analysis showed both quantitative and qualitative differences between depths. EST libraries had only the 3% of transcripts in common. A total of 315 peptides belonging to 64 proteins were identified by mass spectrometry. ATP synthase subunits were among the most abundant proteins in both conditions. Both approaches identified genes and proteins in pathways related to energy metabolism, transport and genetic information processing, that appear o be the most involved in depth acclimation in P. oceanica. Their putative rules in acclimation to depth were discussed.

  13. Acclimation to different depths by the marine angiosperm Posidonia oceanica: transcriptomic and proteomic profiles.

    Science.gov (United States)

    Dattolo, Emanuela; Gu, Jenny; Bayer, Philipp E; Mazzuca, Silvia; Serra, Ilia A; Spadafora, Antonia; Bernardo, Letizia; Natali, Lucia; Cavallini, Andrea; Procaccini, Gabriele

    2013-01-01

    For seagrasses, seasonal and daily variations in light and temperature represent the mains factors driving their distribution along the bathymetric cline. Changes in these environmental factors, due to climatic and anthropogenic effects, can compromise their survival. In a framework of conservation and restoration, it becomes crucial to improve our knowledge about the physiological plasticity of seagrass species along environmental gradients. Here, we aimed to identify differences in transcriptomic and proteomic profiles, involved in the acclimation along the depth gradient in the seagrass Posidonia oceanica, and to improve the available molecular resources in this species, which is an important requisite for the application of eco-genomic approaches. To do that, from plant growing in shallow (-5 m) and deep (-25 m) portions of a single meadow, (i) we generated two reciprocal Expressed Sequences Tags (EST) libraries using a Suppressive Subtractive Hybridization (SSH) approach, to obtain depth/specific transcriptional profiles, and (ii) we identified proteins differentially expressed, using the highly innovative USIS mass spectrometry methodology, coupled with 1D-SDS electrophoresis and labeling free approach. Mass spectra were searched in the open source Global Proteome Machine (GPM) engine against plant databases and with the X!Tandem algorithm against a local database. Transcriptional analysis showed both quantitative and qualitative differences between depths. EST libraries had only the 3% of transcripts in common. A total of 315 peptides belonging to 64 proteins were identified by mass spectrometry. ATP synthase subunits were among the most abundant proteins in both conditions. Both approaches identified genes and proteins in pathways related to energy metabolism, transport and genetic information processing, that appear to be the most involved in depth acclimation in P. oceanica. Their putative rules in acclimation to depth were discussed.

  14. Observed damage during Argon gas cluster depth profiles of compound semiconductors

    Energy Technology Data Exchange (ETDEWEB)

    Barlow, Anders J., E-mail: anders.barlow@ncl.ac.uk; Portoles, Jose F.; Cumpson, Peter J. [National EPSRC XPS Users' Service (NEXUS), School of Mechanical and Systems Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU (United Kingdom)

    2014-08-07

    Argon Gas Cluster Ion Beam (GCIB) sources have become very popular in XPS and SIMS in recent years, due to the minimal chemical damage they introduce in the depth-profiling of polymer and other organic materials. These GCIB sources are therefore particularly useful for depth-profiling polymer and organic materials, but also (though more slowly) the surfaces of inorganic materials such as semiconductors, due to the lower roughness expected in cluster ion sputtering compared to that introduced by monatomic ions. We have examined experimentally a set of five compound semiconductors, cadmium telluride (CdTe), gallium arsenide (GaAs), gallium phosphide (GaP), indium arsenide (InAs), and zinc selenide (ZnSe) and a high-κ dielectric material, hafnium oxide (HfO), in their response to argon cluster profiling. An experimentally determined HfO etch rate of 0.025 nm/min (3.95 × 10{sup −2} amu/atom in ion) for 6 keV Ar gas clusters is used in the depth scale conversion for the profiles of the semiconductor materials. The assumption has been that, since the damage introduced into polymer materials is low, even though sputter yields are high, then there is little likelihood of damaging inorganic materials at all with cluster ions. This seems true in most cases; however, in this work, we report for the first time that this damage can in fact be very significant in the case of InAs, causing the formation of metallic indium that is readily visible even to the naked eye.

  15. Depth profile analysis of electrodeposited nanoscale multilayers by Secondary Neutral Mass Spectrometry (SNMS)

    International Nuclear Information System (INIS)

    Katona, G.L.; Berenyi, Z.; Vad, K.; Peter, L.

    2006-01-01

    Complete text of publication follows. Nanoscale multilayers have been in the focus of research since the discovery of the giant magnetoresistance (GMR) effect in this family of nanostructures. The first observation of GMR on sputtered magnetic/non-magnetic multilayers was followed by the detection of the same effect in electrodeposited Co-Ni-Cu/Cu multilayers within half a decade. Electrodeposition has long been considered as an inexpensive alternative of the high-vacuum methods to produce multilayers with GMR, although the GMR effect observed for electrodeposited multilayers is usually inferior to multilayers produced by physical methods. Electrochemistry appears to be an exclusive technology to produce multilayered nanowires by using porous templates. In spite of the large number of papers about the multilayers themselves, data on the depth profile of electrodeposited multilayer samples are very scarce. It has long been known that the simultaneous electrodeposition of the iron group metals takes place in the so-called anomalous manner. The diagnostic criterion of the anomalous codeposition is that the metallic component of lower standard potential (the Co in the case of Ni/Co) can be discharged together with the more noble one (Ni) at potentials where the less noble component (Co) alone cannot be deposited onto a substrate composed of the parent metal; moreover, the less noble metal (Co) is deposited preferentially. We have investigated the composition gradient along the growth direction of electrodeposited Co/Cu and CoNiCu/Cu multilayers films using SNMS. Samples were electrodeposited using the single bath method. Commercial Cu sheets and an Cr/Cu layer evaporated onto Si (111) surface were used as substrates with high and low roughness, respectively. The depth profiles of the samples were recorded using SNMS (INA-X, Specs GmbH, Berlin) in the Direct Bombardment Mode. Depth profile analysis of electrodeposited magnetic/nonmagnetic layered structures on

  16. Electrochemical depth profiling of multilayer metallic structures: An aluminum brazing sheet

    DEFF Research Database (Denmark)

    Afshar, F. Norouzi; Ambat, R.; Kwakernaak, C.

    2012-01-01

    Combinatory localized electrochemical cell and glow discharge optical emission spectrometry (GDOES) measurements were performed to obtain a thorough in depth electrochemical characterization of an aluminum brazing sheet. By defining electrochemical criteria i.e. breakdown potential, corrosion...... potential, cathodic and anodic reactivities, and tracking their changes as a function of depth, the evolution of electrochemical responses through out the material thickness were analyzed and correlated to the corresponding microstructural features. Polarization curves in 1wt% NaCl solution at pH 2.8 were...... obtained at different depths from the surface using controlled sputtering in a glow discharge optical emission spectrometer as a sample preparation technique. The anodic and cathodic reactivity of the top surface areas were significantly higher than that of the bulk, thus indicating these areas to be more...

  17. Sediment mixing and accumulation rate effects on radionuclide depth profiles in Hudson estuary sediments

    International Nuclear Information System (INIS)

    Olsen, C.R.; Simpson, H.J.; Peng, T.; Bopp, R.F.; Trier, R.M.

    1981-01-01

    Measured anthropogenic radionuclide profiles in sediment cores from the Hudson River estuary were compared with profiles computed by using known input histories of radionuclides to the estuary and mixing coefficients which decreased exponentially with depth in the sediment. Observed 134 Cs sediment depth profiles were used in the mixing rate computation because reactor releases were the only significant source for this nuclide, whereas the inputs of 137 Cs and /sup 239.240/Pu to the estuary were complicated by runoff or erosion in upstream areas, in addition to direct fallout from precipitation. Our estimates for the rates of surface sediment mixing in the low salinity reach of the estuary range from 0.25 to 1 cm 2 /yr, or less. In some areas of the harbor adjacent to New York City, were fine-particle accumulation rates are generally >3 cm/yr, and often as high as 10 to 20 cm/yr, sediment mixing rates as high as 10 cm 2 /yr would have little effect on radionuclide peak distributions. Consequently, anthropogenic radionuclide maximum activities in subsurface sediments of the Hudson appear to be useful as time-stratigraphic reference levels, which can be correlated with periods of maximum radionuclide inputs for estimating rates and patterns of sediment accumulation

  18. Depth profiling of superconducting thin films using rare gas ion sputtering with laser postionization

    International Nuclear Information System (INIS)

    Pallix, J.B.; Becker, C.H.; Missert, N.; Char, K.; Hammond, R.H.

    1988-01-01

    Surface analysis by laser ionization (SALI) has been used to examine a high-T/sub c/ superconducting thin film of nominal composition YBa 2 Cu 3 O 7 deposited on SrTiO 3 (100) by reactive magnetron sputtering. The main focus of this work was to probe the compositional uniformity and the impurity content throughout the 1800 A thick film having critical current densities of 1 to 2 x 10 6 A/cm 2 . SALI depth profiles show this film to be more uniform than thicker films (∼1 μm, prepared by electron beam codeposition) which were studied previously, yet the data show that some additional (non-superconducting) phases derived from Y, Ba, Cu, and O are still present. These additional phases are studied by monitoring the atomic and diatomic-oxide photoion profiles and also the depth profiles of various clusters (e.g. Y 2 O 2 + , Y 2 O 3 + , Y 3 O 4 + , Ba 2 O + , Ba 2 O 2 + , BaCu + , BaCuO + , YBaO 2 + , YSrO 2 + , etc.). A variety of impurities are observed to occur throughout the film including rather large concentrations of Sr. Hydroxides, F, Cl, and CO/sub x/ are evident particularly in the sample's near surface region (the top ∼100 A)

  19. Depth profiling of superconducting thin films using rare gas ion sputtering with laser postionization

    Science.gov (United States)

    Pallix, J. B.; Becker, C. H.; Missert, N.; Char, K.; Hammond, R. H.

    1988-02-01

    Surface analysis by laser ionization (SALI) has been used to examine a high-Tc superconducting thin film of nominal composition YBa2Cu3O7 deposited on SrTiO3 (100) by reactive magnetron sputtering. The main focus of this work was to probe the compositional uniformity and the impurity content throughout the 1800 Å thick film having critical current densities of 1 to 2×106 A/cm2. SALI depth profiles show this film to be more uniform than thicker films (˜1 μm, prepared by electron beam codeposition) which were studied previously, yet the data show that some additional (non-superconducting) phases derived from Y, Ba, Cu, and O are still present. These additional phases are studied by monitoring the atomic and diatomic-oxide photoion profiles and also the depth profiles of various clusters (e.g. Y2O2+, Y2O3+, Y3O4+, Ba2O+, Ba2O2+, BaCu+, BaCuO+, YBaO2+, YSrO2+, etc.). A variety of impurities are observed to occur throughout the film including rather large concentrations of Sr. Hydroxides, F, Cl, and COx are evident particularly in the sample's near surface region (the top ˜100 Å).

  20. Reconstruction of original indium distribution in InGaAs quantum wells from experimental SIMS depth profiles

    Energy Technology Data Exchange (ETDEWEB)

    Kudriavtsev, Yu., E-mail: yuriyk@cinvestav.mx [Departamento Ingeniería Eléctrica – SEES, CINVESTAV-IPN, Av. IPN #2508, D.F., México (Mexico); Asomoza, R. [Departamento Ingeniería Eléctrica – SEES, CINVESTAV-IPN, Av. IPN #2508, D.F., México (Mexico); Gallardo-Hernandez, S.; Ramirez-Lopez, M.; Lopez-Lopez, M. [Departamento de Física, CINVESTAV-IPN, México (Mexico); Nevedomsky, V.; Moiseev, K. [Ioffe Physical Technical Institute, S-Petersburg (Russian Federation)

    2014-11-15

    Depth profiling analysis of InGaAs/GaAs hetero-structures grown by MBE on GaAs (0 0 1) substrates is reported. A novel two-step procedure for de-convolving experimental SIMS depth distribution is employed and the original In distribution in InGaAs quantum wells (QW) is estimated. The QW thickness calculated from the de-convolved profiles is shown to be in good agreement with the cross-sectional TEM images. The experimental In depth profile is shifted from the original In distribution due to the ion mixing process during depth profiling analysis. It is shown that the de-convolution procedure is suitable for reconstruction of the original QW width and depth by SIMS even for relatively high primary ion energies.

  1. Depth Profiling Analysis of Aluminum Oxidation During Film Deposition in a Conventional High Vacuum System

    Science.gov (United States)

    Kim, Jongmin; Weimer, Jeffrey J.; Zukic, Muamer; Torr, Douglas G.

    1994-01-01

    The oxidation of aluminum thin films deposited in a conventional high vacuum chamber has been investigated using x-ray photoelectron spectroscopy (XPS) and depth profiling. The state of the Al layer was preserved by coating it with a protective MgF2 layer in the deposition chamber. Oxygen concentrations in the film layers were determined as a function of sputter time (depth into the film). The results show that an oxidized layer is formed at the start of Al deposition and that a less extensively oxidized Al layer is deposited if the deposition rate is fast. The top surface of the Al layer oxidizes very quickly. This top oxidized layer may be thicker than has been previously reported by optical methods. Maximum oxygen concentrations measured by XPS at each Al interface are related to pressure to rate ratios determined during the Al layer deposition.

  2. Influence of crack length on crack depth measurement by an alternating current potential drop technique

    International Nuclear Information System (INIS)

    Raja, Manoj K; Mahadevan, S; Rao, B P C; Behera, S P; Jayakumar, T; Raj, Baldev

    2010-01-01

    An alternating current potential drop (ACPD) technique is used for sizing depth of surface cracks in metallic components. Crack depth estimations are prone to large deviations when ACPD measurements are made on very shallow and finite length cracks, especially in low conducting materials such as austenitic stainless steel (SS). Detailed studies have been carried out to investigate the influence of crack length and aspect ratio (length to depth) on depth estimation by performing measurements on electric discharge machined notches with the aspect ratio in the range of 1 to 40 in SS plates. In notches with finite length, an additional path for current to flow through the surface along the length is available causing the notch depths to be underestimated. The experimentally observed deviation in notch depth estimates is explained from a simple mathematical approach using the equivalent resistive circuit model based on the additional path available for the current to flow. A scheme is proposed to accurately measure the depth of cracks with finite lengths in SS components

  3. Stable carbon isotope depth profiles and soil organic carbon dynamics in the lower Mississippi Basin

    Science.gov (United States)

    Wynn, J.G.; Harden, J.W.; Fries, T.L.

    2006-01-01

    Analysis of depth trends of 13C abundance in soil organic matter and of 13C abundance from soil-respired CO2 provides useful indications of the dynamics of the terrestrial carbon cycle and of paleoecological change. We measured depth trends of 13C abundance from cropland and control pairs of soils in the lower Mississippi Basin, as well as the 13C abundance of soil-respired CO2 produced during approximately 1-year soil incubation, to determine the role of several candidate processes on the 13C depth profile of soil organic matter. Depth profiles of 13C from uncultivated control soils show a strong relationship between the natural logarithm of soil organic carbon concentration and its isotopic composition, consistent with a model Rayleigh distillation of 13C in decomposing soil due to kinetic fractionation during decomposition. Laboratory incubations showed that initially respired CO 2 had a relatively constant 13C content, despite large differences in the 13C content of bulk soil organic matter. Initially respired CO2 was consistently 13C-depleted with respect to bulk soil and became increasingly 13C-depleted during 1-year, consistent with the hypothesis of accumulation of 13C in the products of microbial decomposition, but showing increasing decomposition of 13C-depleted stable organic components during decomposition without input of fresh biomass. We use the difference between 13C / 12C ratios (calculated as ??-values) between respired CO 2 and bulk soil organic carbon as an index of the degree of decomposition of soil, showing trends which are consistent with trends of 14C activity, and with results of a two-pooled kinetic decomposition rate model describing CO2 production data recorded during 1 year of incubation. We also observed inconsistencies with the Rayleigh distillation model in paired cropland soils and reasons for these inconsistencies are discussed. ?? 2005 Elsevier B.V. All rights reserved.

  4. Photothermal depth profiling: Comparison between genetic algorithms and thermal wave backscattering (abstract)

    Science.gov (United States)

    Li Voti, R.; Sibilia, C.; Bertolotti, M.

    2003-01-01

    Photothermal depth profiling has been the subject of many papers in the last years. Inverse problems on different kinds of materials have been identified, classified, and solved. A first classification has been done according to the type of depth profile: the physical quantity to be reconstructed is the optical absorption in the problems of type I, the thermal effusivity for type II, and both of them for type III. Another classification may be done depending on the time scale of the pump beam heating (frequency scan, time scan), or on its geometrical symmetry (one- or three-dimensional). In this work we want to discuss two different approaches, the genetic algorithms (GA) [R. Li Voti, C. Melchiorri, C. Sibilia, and M. Bertolotti, Anal. Sci. 17, 410 (2001); R. Li Voti, Proceedings, IV Int. Workshop on Advances in Signal Processing for Non-Destructive Evaluation of Materials, Quebec, August 2001] and the thermal wave backscattering (TWBS) [R. Li Voti, G. L. Liakhou, S. Paoloni, C. Sibilia, and M. Bertolotti, Anal. Sci. 17, 414 (2001); J. C. Krapez and R. Li Voti, Anal. Sci. 17, 417 (2001)], showing their performances and limits of validity for several kinds of photothermal depth profiling problems: The two approaches are based on different mechanisms and exhibit obviously different features. GA may be implemented on the exact heat diffusion equation as follows: one chromosome is associated to each profile. The genetic evolution of the chromosome allows one to find better and better profiles, eventually converging towards the solution of the inverse problem. The main advantage is that GA may be applied to any arbitrary profile, but several disadvantages exist; for example, the complexity of the algorithm, the slow convergence, and consequently the computer time consumed. On the contrary, TWBS uses a simplified theoretical model of heat diffusion in inhomogeneous materials. According to such a model, the photothermal signal depends linearly on the thermal effusivity

  5. Techniques of surface optical breakdown prevention for low-depths femtosecond waveguides writing

    International Nuclear Information System (INIS)

    Bukharin, M A; Skryabin, N N; Ganin, D V; Khudyakov, D V; Vartapetov, S.K.

    2016-01-01

    We demonstrated technique of direct femtosecond waveguide writing at record low depth (2-15 μm) under surface of lithium niobate, that play a key role in design of electrooptical modulators with low operating voltage. To prevent optical breakdown of crystal surface we used high numerical aperture objectives for focusing of light and non-thermal regime of inscription in contrast to widespread femtosecond writing technique at depths of tens micrometers or higher. Surface optical breakdown threshold was measured for both x- and z- cut crystals. Inscribed waveguides were examined for intrinsic microstructure. It also reported sharp narrowing of operating pulses energy range with writing depth under the surface of crystal, that should be taken in account when near-surface waveguides design. Novelty of the results consists in reduction of inscription depth under the surface of crystals that broadens applications of direct femtosecond writing technique to full formation of near-surface waveguides and postproduction precise geometry correction of near-surfaces optical integrated circuits produced with proton-exchanged technique. (paper)

  6. Degradation effects ad Si-depth profiling in photoresists using ion beam analysis

    International Nuclear Information System (INIS)

    Ijzendoorn, L.J. van; Schellekens, J.P.W.

    1989-01-01

    The reaction of silicon-containing vapour with a photoresist layer, as used in dry developable lithographic processes, was studied with Rutherford backscattering spectrometry (RBS). Degradation of the polymer layer was observed, but the total amount of incorporated Si was found to be constant during the measurement. Si-depth profiles were found to be independent of dose and in agreement with profiles obtained with secondary ion mass spectrometry (SIMS). The detection of hydrogen by elastic recoil detection (ERD) was used to study the degradation in detail. The decrease in hydrogen countrate from a layer of polystyrene on Si in combination with the shift of the Si-substrate edge in the corresponding RBS spectra was used for a model description. Only one degradation cross-section for hydrogen and one for carbon, both independent of beam current and dose, were required for a successful fit of the experimental data. (orig.)

  7. Quantitative Auger depth profiling of LPCVD and PECVD silicon nitride films

    International Nuclear Information System (INIS)

    Keim, E.G.; Aite, K.

    1989-01-01

    Thin silicon nitride films (100-210 nm) with refractive indices varying from 1.90 to 2.10 were deposited on silicon substrates by low pressure chemical vapour deposition (LPCVD) and plasma enhanced chemical vapour deposition (PECVD). Rutherford backscattering spectrometry (RBS), ellipsometry, surface profiling measurements and Auger electron spectroscopy (AES) in combination with Ar + sputtering were used to characterize these films. We have found that the use of (p-p)heights of the Si LVV and N KLL Auger transitions in the first derivative of the energy distribution (dN(E)/dE) leads to an accurate determination of the silicon nitride composition in Auger depth profiles over a wide range of atomic Si/N ratios. Moreover, we have shown that the Si KLL Auger transition, generally considered to be a better probe than the low energy Si LVV Auger transition in determining the chemical composition of silicon nitride layers, leads to deviating results. (orig.)

  8. Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures

    International Nuclear Information System (INIS)

    Baumbach, T.; Bruehl, H.G.; Rhan, H.; Pietsch, U.

    1988-01-01

    The compositional depth profile in semiconductor heterostructures can be determined from X-ray diffraction patterns. Different grading profiles were studied through theoretical simulations with regard to their features in the rocking curve. It was found that the thickness and the grading of a particular layer cannot be determined independently of each other. A linear grading gives rise to an increased peak width of the layer diffraction peak whereas an exponential grading can be detected from the damping of high-order interference fringes. The exponential model can be applied to determine the abruptness of the heterointerfaces. The proposed evaluation method of experimental rocking curves includes the case of overlapping peaks of the layer and the substrate diffraction. The simulation results are discussed for a GaAs/Ga 1-x Al x As/GaAs[100] double heterostructure. When the experimental resolution is taken into account, the sensitivity of the interface width determination was 100-200 A. (orig.)

  9. Depth profiling of inks in authentic and counterfeit banknotes by electrospray laser desorption ionization/mass spectrometry.

    Science.gov (United States)

    Kao, Yi-Ying; Cheng, Sy-Chyi; Cheng, Chu-Nian; Shiea, Jentaie

    2016-01-01

    Electrospray laser desorption ionization is an ambient ionization technique that generates neutrals via laser desorption and ionizes those neutrals in an electrospray plume and was utilized to characterize inks in different layers of copy paper and banknotes of various currencies. Depth profiling of inks was performed on overlapping color bands on copy paper by repeatedly scanning the line with a pulsed laser beam operated at a fixed energy. The molecules in the ink on a banknote were desorbed by irradiating the banknote surface with a laser beam operated at different energies, with results indicating that different ions were detected at different depths. The analysis of authentic $US100, $100 RMB and $1000 NTD banknotes indicated that ions detected in 'color-shifting' and 'typography' regions were significantly different. Additionally, the abundances of some ions dramatically changed with the depth of the aforementioned regions. This approach was used to distinguish authentic $1000 NTD banknotes from counterfeits. Copyright © 2015 John Wiley & Sons, Ltd. Copyright © 2015 John Wiley & Sons, Ltd.

  10. Analysis of the Tikhonov regularization to retrieve thermal conductivity depth-profiles from infrared thermography data

    Science.gov (United States)

    Apiñaniz, Estibaliz; Mendioroz, Arantza; Salazar, Agustín; Celorrio, Ricardo

    2010-09-01

    We analyze the ability of the Tikhonov regularization to retrieve different shapes of in-depth thermal conductivity profiles, usually encountered in hardened materials, from surface temperature data. Exponential, oscillating, and sigmoidal profiles are studied. By performing theoretical experiments with added white noises, the influence of the order of the Tikhonov functional and of the parameters that need to be tuned to carry out the inversion are investigated. The analysis shows that the Tikhonov regularization is very well suited to reconstruct smooth profiles but fails when the conductivity exhibits steep slopes. We check a natural alternative regularization, the total variation functional, which gives much better results for sigmoidal profiles. Accordingly, a strategy to deal with real data is proposed in which we introduce this total variation regularization. This regularization is applied to the inversion of real data corresponding to a case hardened AISI1018 steel plate, giving much better anticorrelation of the retrieved conductivity with microindentation test data than the Tikhonov regularization. The results suggest that this is a promising way to improve the reliability of local inversion methods.

  11. Techniques for depth-resolved imaging through turbid media including coherence-gated imaging

    International Nuclear Information System (INIS)

    Dunsby, C; French, P M W

    2003-01-01

    This article aims to review the panoply of techniques for realising optical imaging through turbid media such as biological tissue. It begins by briefly discussing optical scattering and outlines the various approaches that have been developed to image through scattering media including spatial filtering, time-gated imaging and coherence-based techniques. The discussion includes scanning and wide-field techniques and concentrates on techniques to discriminate in favour of unscattered ballistic light although imaging with scattered light is briefly reviewed. Wide-field coherence-gated imaging techniques are discussed in some detail with particular emphasis placed on techniques to achieve real-time high-resolution three-dimensional imaging including through turbid media, providing rapid whole-field acquisition and high depth and transverse spatial resolution images. (topical review)

  12. Molecular depth profiling of multi-layer systems with cluster ion sources

    Energy Technology Data Exchange (ETDEWEB)

    Cheng, Juan [Department of Chemistry, Penn State University, University Park, PA 16802 (United States); Winograd, Nicholas [Department of Chemistry, Penn State University, University Park, PA 16802 (United States)]. E-mail: nxw@psu.edu

    2006-07-30

    Cluster bombardment of molecular films has created new opportunities for SIMS research. To more quantitatively examine the interaction of cluster beams with organic materials, we have developed a reproducible platform consisting of a well-defined sugar film (trehalose) doped with peptides. Molecular depth profiles have been acquired with these systems using C{sub 60} {sup +} bombardment. In this study, we utilize this platform to determine the feasibility of examining buried interfaces for multi-layer systems. Using C{sub 60} {sup +} at 20 keV, several systems have been tested including Al/trehalose/Si, Al/trehalose/Al/Si, Ag/trehalose/Si and ice/trehalose/Si. The results show that there can be interactions between the layers during the bombardment process that prevent a simple interpretation of the depth profile. We find so far that the best results are obtained when the mass of the overlayer atoms is less than or nearly equal to the mass of the atoms in buried molecules. In general, these observations suggest that C{sub 60} {sup +} bombardment can be successfully applied to interface characterization of multi-layer systems if the systems are carefully chosen.

  13. Deuterium depth profiling in JT-60U W-shaped divertor tiles by nuclear reaction analysis

    International Nuclear Information System (INIS)

    Hayashi, T.; Ochiai, K.; Masaki, K.; Gotoh, Y.; Kutsukake, C.; Arai, T.; Nishitani, T.; Miya, N.

    2006-01-01

    Deuterium concentrations and depth profiles in plasma-facing graphite tiles used in the divertor of JAERI Tokamak-60 Upgrade (JT-60U) were investigated by nuclear reaction analysis (NRA). The highest deuterium concentration of D/ 12 C of 0.053 was found in the outer dome wing tile, where the deuterium accumulated probably through the deuterium-carbon co-deposition. In the outer and inner divertor target tiles, the D/ 12 C data were lower than 0.006. Additionally, the maximum (H + D)/ 12 C in the dome top tile was estimated to be 0.023 from the results of NRA and secondary ion mass spectroscopy (SIMS). Orbit following Monte-Carlo (OFMC) simulation showed energetic deuterons caused by neutral beam injections (NBI) were implanted into the dome region with high heat flux. Furthermore, the surface temperature and conditions such as deposition and erosion significantly influenced the accumulation process of deuterium. The deuterium depth profile, scanning electron microscope (SEM) observation and OFMC simulation indicated the deuterium was considered to accumulate through three processes: the deuterium-carbon co-deposition, the implantation of energetic deuterons and the deuterium diffusion into the bulk

  14. 3D-TV System with Depth-Image-Based Rendering Architectures, Techniques and Challenges

    CERN Document Server

    Zhao, Yin; Yu, Lu; Tanimoto, Masayuki

    2013-01-01

    Riding on the success of 3D cinema blockbusters and advances in stereoscopic display technology, 3D video applications have gathered momentum in recent years. 3D-TV System with Depth-Image-Based Rendering: Architectures, Techniques and Challenges surveys depth-image-based 3D-TV systems, which are expected to be put into applications in the near future. Depth-image-based rendering (DIBR) significantly enhances the 3D visual experience compared to stereoscopic systems currently in use. DIBR techniques make it possible to generate additional viewpoints using 3D warping techniques to adjust the perceived depth of stereoscopic videos and provide for auto-stereoscopic displays that do not require glasses for viewing the 3D image.   The material includes a technical review and literature survey of components and complete systems, solutions for technical issues, and implementation of prototypes. The book is organized into four sections: System Overview, Content Generation, Data Compression and Transmission, and 3D V...

  15. Dual beam organic depth profiling using large argon cluster ion beams

    Science.gov (United States)

    Holzweber, M; Shard, AG; Jungnickel, H; Luch, A; Unger, WES

    2014-01-01

    Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq3), materials commonly used in organic light-emitting diodes industry, was carried out using time-of-flight SIMS in dual beam mode. The sample used in this study consists of a ∽400-nm-thick NPB matrix with 3-nm marker layers of Alq3 at depth of ∽50, 100, 200 and 300 nm. Argon cluster sputtering provides a constant sputter yield throughout the depth profiles, and the sputter yield volumes and depth resolution are presented for Ar-cluster sizes of 630, 820, 1000, 1250 and 1660 atoms at a kinetic energy of 2.5 keV. The effect of cluster size in this material and over this range is shown to be negligible. © 2014 The Authors. Surface and Interface Analysis published by John Wiley & Sons Ltd. PMID:25892830

  16. Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

    Directory of Open Access Journals (Sweden)

    Patrick Philipp

    2016-11-01

    Full Text Available The analysis of polymers by secondary ion mass spectrometry (SIMS has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM, which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.

  17. Quantitative damage depth profiles in arsenic implanted HgCdTe

    Energy Technology Data Exchange (ETDEWEB)

    Lobre, C., E-mail: clement.lobre@cea.fr [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Jalabert, D. [CEA-INAC/UJF-Grenoble 1 UMR-E, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Vickridge, I.; Briand, E.; Benzeggouta, D. [Institut des NanoSciences de Paris, UMR 7588 du CNRS, Universite de Pierre et Marie Curie, Paris (France); Mollard, L. [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Jouneau, P.H. [CEA-INAC/UJF-Grenoble 1 UMR-E, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Ballet, P. [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France)

    2013-10-15

    Rutherford backscattering experiments under channeling conditions (RBS-c) have been carried out on Hg{sub 0.77}Cd{sub 0.23}Te (MCT) layers implanted with arsenic. Accurate damage profiles have been extracted through a simple formalism for implanted and annealed layers. Quantitative damage profiles are correlated with structural defects observed by bright-field scanning transmission electron microscopy (BF-STEM) and chemical composition measured by secondary ion mass spectrometry (SIMS). Evolution of damage for increasing ion implantation fluence has been investigated by these three complementary techniques. Evidence is found of irradiation induced annealing during implantation. A fast damage recovery has been observed for post-implantation thermal anneals. In the case of an implanted layer annealed during 1 h, the damage profile, associated with arsenic concentration measurements, indicates the presence of complexes involving arsenic.

  18. Quantitative damage depth profiles in arsenic implanted HgCdTe

    International Nuclear Information System (INIS)

    Lobre, C.; Jalabert, D.; Vickridge, I.; Briand, E.; Benzeggouta, D.; Mollard, L.; Jouneau, P.H.; Ballet, P.

    2013-01-01

    Rutherford backscattering experiments under channeling conditions (RBS-c) have been carried out on Hg 0.77 Cd 0.23 Te (MCT) layers implanted with arsenic. Accurate damage profiles have been extracted through a simple formalism for implanted and annealed layers. Quantitative damage profiles are correlated with structural defects observed by bright-field scanning transmission electron microscopy (BF-STEM) and chemical composition measured by secondary ion mass spectrometry (SIMS). Evolution of damage for increasing ion implantation fluence has been investigated by these three complementary techniques. Evidence is found of irradiation induced annealing during implantation. A fast damage recovery has been observed for post-implantation thermal anneals. In the case of an implanted layer annealed during 1 h, the damage profile, associated with arsenic concentration measurements, indicates the presence of complexes involving arsenic

  19. Response function during oxygen sputter profiling and its application to deconvolution of ultrashallow B depth profiles in Si

    International Nuclear Information System (INIS)

    Shao Lin; Liu Jiarui; Wang Chong; Ma, Ki B.; Zhang Jianming; Chen, John; Tang, Daniel; Patel, Sanjay; Chu Weikan

    2003-01-01

    The secondary ion mass spectrometry (SIMS) response function to a B 'δ surface layer' has been investigated. Using electron-gun evaporation combined with liquid nitrogen cooling of target, we are able to deposit an ultrathin B layer without detectable island formation. The B spatial distribution obtained from SIMS is exponentially decaying with a decay length approximately a linear function of the incident energy of the oxygen during the SIMS analysis. Deconvolution with the response function has been applied to reconstruct the spatial distribution of ultra-low-energy B implants. A correction to depth and yield scales due to transient sputtering near the Si surface region was also applied. Transient erosion shifts the profile shallower, but beam mixing shifts it deeper. These mutually compensating effects make the adjusted distribution almost the same as original data. The one significant difference is a buried B peak observed near the surface region

  20. Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen flooding

    International Nuclear Information System (INIS)

    Liu, R.; Wee, A.T.S.

    2004-01-01

    Following the increasingly stringent requirements in the characterization of sub-micron IC devices, an understanding of the various factors affecting ultra shallow depth profiling in secondary ion mass spectrometry (SIMS) has become crucial. Achieving high depth resolution (of the order of 1 nm) is critical in the semiconductor industry today, and various methods have been developed to optimize depth resolution. In this paper, we will discuss ultra shallow SIMS depth profiling using B and Ge delta-doped Si samples using low energy 0.5 keV O 2 + primary beams. The relationship between depth resolution of the delta layers and surface topography measured by atomic force microscopy (AFM) is studied. The effect of oxygen flooding and sample rotation, used to suppress surface roughening is also investigated. Oxygen flooding was found to effectively suppress roughening and gives the best depth resolution for B, but sample rotation gives the best resolution for Ge. Possible mechanisms for this are discussed

  1. Depth estimation of features in video frames with improved feature matching technique using Kinect sensor

    Science.gov (United States)

    Sharma, Kajal; Moon, Inkyu; Kim, Sung Gaun

    2012-10-01

    Estimating depth has long been a major issue in the field of computer vision and robotics. The Kinect sensor's active sensing strategy provides high-frame-rate depth maps and can recognize user gestures and human pose. This paper presents a technique to estimate the depth of features extracted from video frames, along with an improved feature-matching method. In this paper, we used the Kinect camera developed by Microsoft, which captured color and depth images for further processing. Feature detection and selection is an important task for robot navigation. Many feature-matching techniques have been proposed earlier, and this paper proposes an improved feature matching between successive video frames with the use of neural network methodology in order to reduce the computation time of feature matching. The features extracted are invariant to image scale and rotation, and different experiments were conducted to evaluate the performance of feature matching between successive video frames. The extracted features are assigned distance based on the Kinect technology that can be used by the robot in order to determine the path of navigation, along with obstacle detection applications.

  2. CREST-SAFE: Snow LST validation, wetness profiler creation, and depth/SWE product development

    Science.gov (United States)

    Perez Diaz, C. L.; Lakhankar, T.; Romanov, P.; Khanbilvardi, R.; Munoz Barreto, J.; Yu, Y.

    2017-12-01

    CREST-SAFE: Snow LST validation, wetness profiler creation, and depth/SWE product development The Field Snow Research Station (also referred to as Snow Analysis and Field Experiment, SAFE) is operated by the NOAA Center for Earth System Sciences and Remote Sensing Technologies (CREST) in the City University of New York (CUNY). The field station is located within the premises of the Caribou Municipal Airport (46°52'59'' N, 68°01'07'' W) and in close proximity to the National Weather Service (NWS) Regional Forecast Office. The station was established in 2010 to support studies in snow physics and snow remote sensing. The Visible Infrared Imager Radiometer Suite (VIIRS) Land Surface Temperature (LST) Environmental Data Record (EDR) and Moderate Resolution Imaging Spectroradiometer (MODIS) LST product (provided by the Terra and Aqua Earth Observing System satellites) were validated using in situ LST (T-skin) and near-surface air temperature (T-air) observations recorded at CREST-SAFE for the winters of 2013 and 2014. Results indicate that T-air correlates better than T-skin with VIIRS LST data and that the accuracy of nighttime LST retrievals is considerably better than that of daytime. Several trends in the MODIS LST data were observed, including the underestimation of daytime values and night-time values. Results indicate that, although all the data sets showed high correlation with ground measurements, day values yielded slightly higher accuracy ( 1°C). Additionally, we created a liquid water content (LWC)-profiling instrument using time-domain reflectometry (TDR) at CREST-SAFE and tested it during the snow melt period (February-April) immediately after installation in 2014. Results displayed high agreement when compared to LWC estimates obtained using empirical formulas developed in previous studies, and minor improvement over wet snow LWC estimates. Lastly, to improve on global snow cover mapping, a snow product capable of estimating snow depth and snow water

  3. Measurement of moisture depth distribution in composite materials using positron lifetime technique

    International Nuclear Information System (INIS)

    Singh, J.J.; Holt, W.H.; Mock, W. Jr.; Mall, G.H.

    1980-01-01

    Fiber-reinforced resin matrix composites reportedly suffer significant degradation in their mechanical properties when exposed to hot, moist, environments for extended periods. Moisture weakens the fiber matrix bond as well as the matrix shear strength. An important factor in determining the extent of degradation is the depth distribution of moisture in the resin matrix. Despite the importance of measuring moisture distribution and its effects on composite material properties, not enough data are available on suitable nondestructive techniques for detecting and measuring moisture diffusion in organic composite materials. This paper addresses itself to the problem of measuring the moisture content of such materials, with special emphasis on its depth distribution, using positron lifetime technique

  4. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

    Energy Technology Data Exchange (ETDEWEB)

    Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

    2014-09-01

    The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

  5. Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis.

    Science.gov (United States)

    Wilde, Markus; Ohno, Satoshi; Ogura, Shohei; Fukutani, Katsuyuki; Matsuzaki, Hiroyuki

    2016-03-29

    Nuclear reaction analysis (NRA) via the resonant (1)H((15)N,αγ)(12)C reaction is a highly effective method of depth profiling that quantitatively and non-destructively reveals the hydrogen density distribution at surfaces, at interfaces, and in the volume of solid materials with high depth resolution. The technique applies a (15)N ion beam of 6.385 MeV provided by an electrostatic accelerator and specifically detects the (1)H isotope in depths up to about 2 μm from the target surface. Surface H coverages are measured with a sensitivity in the order of ~10(13) cm(-2) (~1% of a typical atomic monolayer density) and H volume concentrations with a detection limit of ~10(18) cm(-3) (~100 at. ppm). The near-surface depth resolution is 2-5 nm for surface-normal (15)N ion incidence onto the target and can be enhanced to values below 1 nm for very flat targets by adopting a surface-grazing incidence geometry. The method is versatile and readily applied to any high vacuum compatible homogeneous material with a smooth surface (no pores). Electrically conductive targets usually tolerate the ion beam irradiation with negligible degradation. Hydrogen quantitation and correct depth analysis require knowledge of the elementary composition (besides hydrogen) and mass density of the target material. Especially in combination with ultra-high vacuum methods for in-situ target preparation and characterization, (1)H((15)N,αγ)(12)C NRA is ideally suited for hydrogen analysis at atomically controlled surfaces and nanostructured interfaces. We exemplarily demonstrate here the application of (15)N NRA at the MALT Tandem accelerator facility of the University of Tokyo to (1) quantitatively measure the surface coverage and the bulk concentration of hydrogen in the near-surface region of a H2 exposed Pd(110) single crystal, and (2) to determine the depth location and layer density of hydrogen near the interfaces of thin SiO2 films on Si(100).

  6. Numerical and experimental depth profile analyses of coated and attached layers by laser-induced breakdown spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Ardakani, H. Afkhami [Laser and Plasma Research Institute, Shahid Beheshti University, G. C., Evin, Tehran (Iran, Islamic Republic of); Tavassoli, S.H., E-mail: h-tavassoli@sbu.ac.i [Laser and Plasma Research Institute, Shahid Beheshti University, G. C., Evin, Tehran (Iran, Islamic Republic of)

    2010-03-15

    Laser-induced breakdown spectroscopy (LIBS) is applied for depth profile analysis of different thicknesses of copper foils attached on steel and aluminum substrates. In order to account interfacial effects, depth profile analysis of copper coated on steel is also carried out. Experiments are done at ambient air and at two different wavelengths of 266 and 1064 nm of a Nd:YAG laser with pulse durations of 5 ns. A three-dimensional model of multi-pulse laser ablation is introduced on the base of normal evaporation mechanism and the simulation results are compared with the experiments. A normalized concentration (C{sup N}) is introduced for determination of interface position and results are compared with the usually used normalized intensity (I{sup N}). The effect of coating thickness on average ablation rate and resolution of depth profiling are examined. There is a correlation coefficient higher than 0.95 between the model and experimental depth profiles based on the C{sup N} method. Depth profile analysis on the base of C{sup N} method shows a better depth resolution in comparison with I{sup N} method .Increase in the layer thickness, leads to a decrease in the ablation rate.

  7. Iodine-129 depth profiles in soil within 30 km from Fukushima Daiichi Nuclear Power Plant

    International Nuclear Information System (INIS)

    Honda, M.; Matsuzaki, H.; Tsuchiya, Y.S.; Nakano, C.; Yamagata, T.; Nagai, H.; Matsushi, Y.; Maejima, Y.

    2013-01-01

    Iodine-129 depth profiles of 13 soil cores were analyzed by AMS to evaluate the distribution and the mobility in soil. The cores were sampled from various fields around the Fukushima Daiichi Nuclear Power Plant (FDNPP). Four cores out of the 13 were collected from almost the same position in Kawauchi village crop field 20 km apart from FDNPP at different times between April 2011 and June 2012 to observe the temporal variation of depth profile of "1"2"9I in soil. On the all of 13 soil cores, clear enhancement of the accident origin "1"2"9I was observed. From the crop field soil cores in Kawauchi village, "1"2"9I inventory was estimated as 43.4±2.7 mBq m"-"2 (3.10x10"1"3 atoms m"-"2). There is positive relationship between relaxation length and the elapsed time since the FDNPP accident. The increase rate of the relaxation length is about 1 cm yr"-"1 which should reflect the downward transfer rate of the Fukushima-derived "1"2"9I. Other 9 cores were collected from various fields including crop fields and man-made soils within 30 km from FDNPP on June 2012. Cumulative "1"2"9I inventory fraction [%] from the surface was calculated. The inventory fraction within top 5 cm varied widely, 65-100% with median 82%. Similarly the inventory fraction within top 10 cm varied 82 to 100% with the median 95%. (author)

  8. Microbial Community Dynamics in Soil Depth Profiles Over 120,000 Years of Ecosystem Development

    Directory of Open Access Journals (Sweden)

    Stephanie Turner

    2017-05-01

    Full Text Available Along a long-term ecosystem development gradient, soil nutrient contents and mineralogical properties change, therefore probably altering soil microbial communities. However, knowledge about the dynamics of soil microbial communities during long-term ecosystem development including progressive and retrogressive stages is limited, especially in mineral soils. Therefore, microbial abundances (quantitative PCR and community composition (pyrosequencing as well as their controlling soil properties were investigated in soil depth profiles along the 120,000 years old Franz Josef chronosequence (New Zealand. Additionally, in a microcosm incubation experiment the effects of particular soil properties, i.e., soil age, soil organic matter fraction (mineral-associated vs. particulate, O2 status, and carbon and phosphorus additions, on microbial abundances (quantitative PCR and community patterns (T-RFLP were analyzed. The archaeal to bacterial abundance ratio not only increased with soil depth but also with soil age along the chronosequence, coinciding with mineralogical changes and increasing phosphorus limitation. Results of the incubation experiment indicated that archaeal abundances were less impacted by the tested soil parameters compared to Bacteria suggesting that Archaea may better cope with mineral-induced substrate restrictions in subsoils and older soils. Instead, archaeal communities showed a soil age-related compositional shift with the Bathyarchaeota, that were frequently detected in nutrient-poor, low-energy environments, being dominant at the oldest site. However, bacterial communities remained stable with ongoing soil development. In contrast to the abundances, the archaeal compositional shift was associated with the mineralogical gradient. Our study revealed, that archaeal and bacterial communities in whole soil profiles are differently affected by long-term soil development with archaeal communities probably being better adapted to

  9. Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

    Energy Technology Data Exchange (ETDEWEB)

    Shard, A. G.; Havelund, Rasmus; Spencer, Steve J.; Gilmore, I. S.; Alexander, Morgan R.; Angerer, Tina B.; Aoyagi, Satoka; Barnes, Jean P.; Benayad, Anass; Bernasik, Andrzej; Ceccone, Giacomo; Counsell, Jonathan D.; Deeks, Christopher; Fletcher, John S.; Graham, Daniel J.; Heuser, Christian; Lee, Tae G.; Marie, Camille; Marzec, Mateusz M.; Mishra, Gautam; Rading, Derk; Renault, Oliver; Scurr, David J.; Shon, Hyun K.; Spampinato, Valentina; Tian, Hua; Wang, Fuyi; Winograd, Nicholas; Wu, Kui; Wucher, Andreas; Zhou, Yufan; Zhu, Zihua

    2015-07-23

    We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the measurement of composition in organic depth profiling. Layered samples with known binary compositions of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-L-phenylalanine in each layer were manufactured in a single batch and distributed to more than 20 participating laboratories. The samples were analyzed using argon cluster ion sputtering and either X-ray Photoelectron Spectroscopy (XPS) or Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to generate depth profiles. Participants were asked to estimate the volume fractions in two of the layers and were provided with the compositions of all other layers. Participants using XPS provided volume fractions within 0.03 of the nominal values. Participants using ToF-SIMS either made no attempt, or used various methods that gave results ranging in error from 0.02 to over 0.10 in volume fraction, the latter representing a 50% relative error for a nominal volume fraction of 0.2. Error was predominantly caused by inadequacy in the ability to compensate for primary ion intensity variations and the matrix effect in SIMS. Matrix effects in these materials appear to be more pronounced as the number of atoms in both the primary analytical ion and the secondary ion increase. Using the participants’ data we show that organic SIMS matrix effects can be measured and are remarkably consistent between instruments. We provide recommendations for identifying and compensating for matrix effects. Finally we demonstrate, using a simple normalization method, that virtually all ToF-SIMS participants could have obtained estimates of volume fraction that were at least as accurate and consistent as XPS.

  10. Small scale temporal distribution of radiocesium in undisturbed coniferous forest soil: Radiocesium depth distribution profiles.

    Science.gov (United States)

    Teramage, Mengistu T; Onda, Yuichi; Kato, Hiroaki

    2016-04-01

    The depth distribution of pre-Fukushima and Fukushima-derived (137)Cs in undisturbed coniferous forest soil was investigated at four sampling dates from nine months to 18 months after the Fukushima nuclear power plant accident. The migration rate and short-term temporal variability among the sampling profiles were evaluated. Taking the time elapsed since the peak deposition of pre-Fukushima (137)Cs and the median depth of the peaks, its downward displacement rates ranged from 0.15 to 0.67 mm yr(-1) with a mean of 0.46 ± 0.25 mm yr(-1). On the other hand, in each examined profile considerable amount of the Fukushima-derived (137)Cs was found in the organic layer (51%-92%). At this moment, the effect of time-distance on the downward distribution of Fukushima-derived (137)Cs seems invisible as its large portion is still found in layers where organic matter is maximal. This indicates that organic matter seems the primary and preferential sorbent of radiocesium that could be associated with the physical blockage of the exchanging sites by organic-rich dusts that act as a buffer against downward propagation of radiocesium, implying radiocesium to be remained in the root zone for considerable time period. As a result, this soil section can be a potential source of radiation dose largely due to high radiocesium concentration coupled with its low density. Generally, such kind of information will be useful to establish a dynamic safety-focused decision support system to ease and assist management actions. Copyright © 2016 Elsevier Ltd. All rights reserved.

  11. Oxygen depth profiling using the 16O(d,α)14N nuclear reaction

    International Nuclear Information System (INIS)

    Khubeis, I.; Al-Rjob, R.

    1997-01-01

    The excitation function of the 16 O(d,α) 14 N nuclear reaction has been determined in the deuteron energy range of 0.88-2.28 MeV. Major resonances are observed at deuteron energies of 0.98, 1.31, 1.53, 1.60, 1.73 and 2.22 MeV. The present results show good agreement with those of Haase and Khubeis, however there is a shift of 60 keV in the first resonance compared with the measurements of Amsel. The use of a thin surface barrier detector (t=22 μm) and a bias voltage of +20 V coupled with a proper pile-up rejection circuit has allowed the determination of the oxygen depth profiling to a resolution of 16 nm for thick targets. This method is efficient in eliminating interferences from other nuclear reactions such as 16 O(d,p) 17 O and 12 C(d,p) 19 C, where emitted protons have severely obscured α-particles from the 16 O(d,α) 14 N reaction. A 1.08 MeV deuteron beam has been employed to increase the α-yield from the target. The target has been tilted at 70 to enhance depth resolution. This reaction is well suited for the determination of oxygen concentration in oxides of high temperature superconductors. (orig.)

  12. Profile in various organic soil depth shrimp pond, Tambak Inti Rakyat, Karawang

    Directory of Open Access Journals (Sweden)

    Yuni Puji Hastuti

    2015-04-01

    Full Text Available ABSTRACTOrganic material in the bottom of the pond is part of the land is a complex and dynamic system, which is sourced from the rest of the feed, plants, and or animals found in the soil that continuously change shape, because it is influenced by biology, physics, and chemistry. This study was aimed to see the profile of organic material consisting of C, N, and C/N ratio and phosphate in different depths of pond with different culture systems. Observation were conducted at Tambak Inti Rakyat, Karawang in traditional, semi-intensive and intensive culture systems. Observation at mangrove area was also observed as control. Sediment samples at the inlet and outlet at three different depths (0‒5 cm, 5‒10 cm, and 10‒15 cm was taken every 30 days to measure the content of C, N, C/N ratio, and total phosphate. During the 120 day maintenance period could be known that in all pond systems were used (traditional, semi-intensive, and intensive the concentration of C-organic and organic-N on average was located in the bottom layer which is a layer of 10‒15 cm. The lack of human intervention from ground pond system, the more diverse the type and amount of organic material contained therein.Keywords: organic materials, subgrade, depth, aquaculture systems, long maintenanceABSTRAKBahan organik di dasar tambak merupakan bagian dari tanah yang merupakan suatu sistem kompleks dan dinamis, yang bersumber dari sisa pakan, tanaman, dan atau binatang yang terdapat di dalam tanah yang terus menerus mengalami perubahan bentuk, karena dipengaruhi oleh faktor biologi, fisika, dan kimia. Penelitian ini bertujuan untuk melihat profil bahan organik yang terdiri dari C, N, dan C/N rasio serta fosfat pada kedalaman tambak yang berbeda dengan sistem budidaya yang berbeda pula. Pengamatan dilakukan di Tambak Inti Rakyat Karawang pada sistem budidaya tradisional, semi intensif, dan intensif. Pengamatan di daerah mangrove diamati pula sebagai kontrol. Sampel sedimen di

  13. What Can Radiocarbon Depth Profiles Tell Us About The LGM Circulation?

    Science.gov (United States)

    Burke, A.; Stewart, A.; Adkins, J. F.; Ferrari, R. M.; Thompson, A. F.; Jansen, M. F.

    2014-12-01

    Published reconstructions of radiocarbon in the Atlantic sector of the Southern Ocean indicate that there is a mid-depth maximum in radiocarbon age during the last glacial maximum (LGM). This is in contrast to the modern ocean where intense mixing between water masses along shared density surfaces (isopycnals) results in a relatively homogenous radiocarbon profile. A recent study (Ferrari et al. 2014) suggested that the extended Antarctic sea ice cover during the LGM necessitated a shallower boundary between the upper and lower branches of the meridional overturning circulation (MOC). This shoaled boundary lay above major topographic features and their associated strong diapycnal mixing, which isolated dense southern-sourced water in the lower branch of the overturning circulation. This isolation would have allowed radiocarbon to decay, and thus provides a possible explanation for the mid-depth radiocarbon age bulge. We test this hypothesis using an idealized, 2D, residual-mean dynamical model of the global overturning circulation. Concentration distributions of a decaying tracer that is advected by the simulated overturning are compared to published radiocarbon data. We test the sensitivity of the mid-depth radiocarbon age to changes in sea ice extent, wind strength, and isopycnal and diapycnal diffusion. The mid-depth radiocarbon age bulge is most likely caused by the different circulation geometry, associated with increased sea ice extent. In particular, with an LGM-like sea ice extent the upper and lower branches of the MOC no longer share isopycnals, so radiocarbon-rich northern-sourced water is no longer mixed rapidly into the southern-sourced water. However, this process alone cannot explain the magnitude of the glacial radiocarbon anomalies; additional isolation (e.g. from reduced air-sea gas exchange associated with the increased sea ice) is required. Ferrari, R., M. F. Jansen, J. F. Adkins, A. Burke, A. L. Stewart, and A. F. Thompson (2014), Antarctic sea

  14. Spatial resolution in depth-controlled surface sensitive x-ray techniques

    International Nuclear Information System (INIS)

    Yun, W.B.; Viccaro, P.J.

    1992-01-01

    The spatial resolution along the surface normal and the total depth probed are two important parameters in depth-controlled surface sensitive X-ray techniques employing grazing incidence geometry. The two parameters are analyzed in terms of optical properties (refractive indices) of the media involved and parameters of the incident X-ray beam: beam divergence, X-ray energy, and spectral bandwidth. We derive analytical expressions of the required beam divergence and spectral bandwidth of the incident beam as a function of the two parameters. Sample calculations are made for X-ray energies between 0.1 and 100 keV and for solid Be, Cu, and Au, representing material matrices consisting of low, medium, and high atomic number elements. A brief discussion on obtaining the required beam divergence and spectral bandwidth from present X-ray sources and optics is given

  15. High resolution measurement of the velocity profiles of channel flows using the particle image velocimetry technique

    International Nuclear Information System (INIS)

    Nor Azizi Mohamed

    2000-01-01

    The high resolution velocity profiles of a uniform steady channel flow and a flow beneath waves were obtained using the particle image velocimetry (PIV) technique. The velocity profiles for each flow were calculated for both components. It is shown that the profiles obtained are very precise, displaying the point velocities from a few millimeters from the bottom of the channel up to the water surface across the water depth. In the case of the wave-induced flow, the profiles are shown under the respective wave phases and given in a plane representation. High resolution measurement of point velocities in a flow is achievable using PIV and invaluable when applied to a complex flow. (Author)

  16. He, U, and Th Depth Profiling of Apatite and Zircon Using Laser Ablation Noble Gas Mass Spectrometry and SIMS

    Science.gov (United States)

    Monteleone, B. D.; van Soest, M. C.; Hodges, K. V.; Hervig, R.; Boyce, J. W.

    2008-12-01

    Conventional (U-Th)/He thermochronology utilizes single or multiple grain analyses of U- and Th-bearing minerals such as apatite and zircon and does not allow for assessment of spatial variation in concentration of He, U, or Th within individual crystals. As such, age calculation and interpretation require assumptions regarding 4He loss through alpha ejection, diffusive redistribution of 4He, and U and Th distribution as an initial condition for these processes. Although models have been developed to predict 4He diffusion parameters, correct for the effect of alpha ejection on calculated cooling ages, and account for the effect of U and Th zonation within apatite and zircon, measurements of 4He, U, and Th distribution have not been combined within a single crystal. We apply ArF excimer laser ablation, combined with noble gas mass spectrometry, to obtain depth profiles within apatite and zircon crystals in order to assess variations in 4He concentration with depth. Our initial results from pre-cut, pre-heated slabs of Durango apatite, each subjected to different T-t schedules, suggest a general agreement of 4He profiles with those predicted by theoretical diffusion models (Farley, 2000). Depth profiles through unpolished grains give reproducible alpha ejection profiles in Durango apatite that deviate from alpha ejection profiles predicted for ideal, homogenous crystals. SIMS depth profiling utilizes an O2 primary beam capable of sputtering tens of microns and measuring sub-micron resolution variation in [U], [Th], and [Sm]. Preliminary results suggest that sufficient [U] and [Th] zonation is present in Durango apatite to influence the form of the 4He alpha ejection profile. Future work will assess the influence of measured [U] and [Th] zonation on previously measured 4He depth profiles. Farley, K.A., 2000. Helium diffusion from apatite; general behavior as illustrated by Durango fluorapatite. J. Geophys. Res., B Solid Earth Planets 105 (2), 2903-2914.

  17. Deuterium Depth Profile in Neutron-Irradiated Tungsten Exposed to Plasma

    International Nuclear Information System (INIS)

    Shimada, Masashi; Cao, G.; Hatano, Y.; Oda, T.; Oya, Y.; Hara, M.; Calderoni, P.

    2011-01-01

    The effect of radiation damage has been mainly simulated using high-energy ion bombardment. The ions, however, are limited in range to only a few microns into the surface. Hence, some uncertainty remains about the increase of trapping at radiation damage produced by 14 MeV fusion neutrons, which penetrate much farther into the bulk material. With the Japan-US joint research project: Tritium, Irradiations, and Thermofluids for America and Nippon (TITAN), the tungsten samples (99.99 % pure from A.L.M.T., 6mm in diameter, 0.2mm in thickness) were irradiated to high flux neutrons at 50 C and to 0.025 dpa in the High Flux Isotope Reactor (HFIR) at the Oak Ridge National Laboratory (ORNL). Subsequently, the neutron-irradiated tungsten samples were exposed to a high-flux deuterium plasma (ion flux: 1021-1022 m-2s-1, ion fluence: 1025-1026 m-2) in the Tritium Plasma Experiment (TPE) at the Idaho National Laboratory (INL). First results of deuterium retention in neutron-irradiated tungsten exposed in TPE have been reported previously. This paper presents the latest results in our on-going work of deuterium depth profiling in neutron-irradiated tungsten via nuclear reaction analysis. The experimental data is compared with the result from non neutron-irradiated tungsten, and is analyzed with the Tritium Migration Analysis Program (TMAP) to elucidate the hydrogen isotope behavior such as retention and depth distribution in neutron-irradiated and non neutron-irradiated tungsten.

  18. Depth profiling of oxide-trapped charges in 6H-SiC MOS structures by slant etching method

    Energy Technology Data Exchange (ETDEWEB)

    Saitoh, Kazunari; Takahashi, Yoshihiro; Ohnishi, Kazunori [Nihon Univ., Tokyo (Japan). Coll. of Science and Technology; Yoshikawa, Masahito; Ohshima, Takeshi; Itoh, Hisayoshi; Nashiyama, Isamu

    1997-03-01

    In this paper, we propose a method to evaluate the depth profile of trapped charges in an oxide layer on SiC. Using this method, 6H-SiC MOS structures with different oxide thickness were fabricated on the same substrate under the same oxidation condition, and the depth profile of oxide-trapped charges before and after {sup 60}Co-gamma ray irradiation were obtained. It is found, from the depth profiling, that the trapping mechanism of electrons and holes in the oxide strongly depends on the bias polarity during irradiation, and these charges are trapped near 6H-SiC/SiO{sub 2} interface. We believe that this method is very useful for estimation of the oxide-trapped charges in 6H-SiC MOS structures. (author)

  19. Defect and dopant depth profiles in boron-implanted silicon studied with channeling and nuclear reaction analysis

    NARCIS (Netherlands)

    Vos, M.; Boerma, D.O.; Smulders, P.J.M.; Oosterhoff, S.

    1986-01-01

    Single crystals of silicon were implanted at RT with 1 MeV boron ions to a dose of 1 × 1015 ions/cm2. The depth profile of the boron was measured using the 2060-keV resonance of the 11B(α, n)14N nuclear reaction. The distribution of the lattice disorder as a function of depth was determined from

  20. Soil temperature modeling at different depths using neuro-fuzzy, neural network, and genetic programming techniques

    Science.gov (United States)

    Kisi, Ozgur; Sanikhani, Hadi; Cobaner, Murat

    2017-08-01

    The applicability of artificial neural networks (ANN), adaptive neuro-fuzzy inference system (ANFIS), and genetic programming (GP) techniques in estimating soil temperatures (ST) at different depths is investigated in this study. Weather data from two stations, Mersin and Adana, Turkey, were used as inputs to the applied models in order to model monthly STs. The first part of the study focused on comparison of ANN, ANFIS, and GP models in modeling ST of two stations at the depths of 10, 50, and 100 cm. GP was found to perform better than the ANN and ANFIS-SC in estimating monthly ST. The effect of periodicity (month of the year) on models' accuracy was also investigated. Including periodicity component in models' inputs considerably increased their accuracies. The root mean square error (RMSE) of ANN models was respectively decreased by 34 and 27 % for the depths of 10 and 100 cm adding the periodicity input. In the second part of the study, the accuracies of the ANN, ANFIS, and GP models were compared in estimating ST of Mersin Station using the climatic data of Adana Station. The ANN models generally performed better than the ANFIS-SC and GP in modeling ST of Mersin Station without local climatic inputs.

  1. Detection and depth determination of corrosion defects in embedded bolts using ultrasonic testing technique

    International Nuclear Information System (INIS)

    Lin, Shan; Fukutomi, Hiroyuki; Yuya, Hideki; Ito, Keisuke

    2011-01-01

    A great number of anchor bolts are used to fix various components to concrete foundation in thermal and nuclear power plants. As aging power plants degrade, it is feared that defects resulted from corrosion may occur underground. In this paper, a measurement method utilizing the phased array technique is developed to detect such defects. Measurement results show that this method can detect local and circumferential corrosion defects introduced artificially, but defect echo position appears to be farther away from the bolt head than is actually the case. A finite element simulation of wave propagation shows that longitudinal waves excited by a phased array probe are mode converted and reflected at the defect and at bolt wall, which results in the position of the defect echo appearing to be farther away than the defect actually is. Moreover, an approach for determining the depth of defects using measurement results is also proposed based on numerical results. The depths determined by the proposed approach agree with the actual depths with a maximum error of 1.8 mm and a RMSE of 1.06 mm. (author)

  2. On-the-fly depth profiling during ablation with ultrashort laser pulses: A tool for accurate micromachining and laser surgery

    International Nuclear Information System (INIS)

    Lausten, Rune; Balling, Peter

    2001-01-01

    A method for accurate depth profiling of a region subjected to ablation with ultrashort laser pulses is demonstrated. Time-gated imaging of the backscattered radiation from the ablation region is performed in a geometry, which allows the depth along a chosen axis on the sample to be determined with a single measurement. The profiling system has a spatial resolution of a few micrometers and applications are promoted by the fact that the measurement is performed with the same pulse that undertakes ablation. This also indicates that the method is inherently suited for in situ on-the-fly measurements. Copyright 2001 American Institute of Physics

  3. Mechanical properties of metallic ribbons investigated by depth sensing indentation technique

    International Nuclear Information System (INIS)

    Pesek, Ladislav; Dobrzanski, Leszek A.; Zubko, Pavol; Konieczny, Jaroslaw

    2006-01-01

    The paper presents mechanical properties of two kinds of Co-based and one Fe-based metallic ribbons by the depth sensing indentation (DSI) technique. Investigations were carried out on two kinds ternary alloy Co 77 Si 11,5 B 11,5 and Fe 78 Si 13 B 9 and multicomponent Co 68 Fe 4 Mo 1 Si 13,5 B 13,5 , which are so-called 'zero-magnetostriction' materials. Metallic ribbons were investigated in amorphous state and partially crystallized state after annealing in 400deg. C in argon atmosphere. Heating of ribbons obtained by melt spinning technique was performed to check its effect on changes of mechanical properties

  4. Structural and magnetic depth profiles of magneto-ionic heterostructures beyond the interface limit

    Energy Technology Data Exchange (ETDEWEB)

    Gilbert, DA; Grutter, AJ; Arenholz, E; Liu, K; Kirby, BJ; Borchers, JA; Maranville, BB

    2016-07-22

    Electric field control of magnetism provides a promising route towards ultralow power information storage and sensor technologies. The effects of magneto-ionic motion have been prominently featured in the modification of interface characteristics. Here, we demonstrate magnetoelectric coupling moderated by voltage-driven oxygen migration beyond the interface in relatively thick AlOx/GdOx/Co(15 nm) films. Oxygen migration and Co magnetization are quantitatively mapped with polarized neutron reflectometry under electro-thermal conditioning. The depth-resolved profiles uniquely identify interfacial and bulk behaviours and a semi-reversible control of the magnetization. Magnetometry measurements suggest changes in the microstructure which disrupt long-range ferromagnetic ordering, resulting in an additional magnetically soft phase. X-ray spectroscopy confirms changes in the Co oxidation state, but not in the Gd, suggesting that the GdOx transmits oxygen but does not source or sink it. These results together provide crucial insight into controlling magnetism via magneto-ionic motion, both at interfaces and throughout the bulk of the films.

  5. Depth profiling of marker layers using x-ray waveguide structures

    International Nuclear Information System (INIS)

    Gupta, Ajay; Rajput, Parasmani; Saraiya, Amit; Reddy, V. R.; Gupta, Mukul; Bernstorff, Sigrid; Amenitsch, H.

    2005-01-01

    It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/M/Si trilayer (M=Fe, W), forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone

  6. Depth profiling of marker layers using x-ray waveguide structures

    Science.gov (United States)

    Gupta, Ajay; Rajput, Parasmani; Saraiya, Amit; Reddy, V. R.; Gupta, Mukul; Bernstorff, Sigrid; Amenitsch, H.

    2005-08-01

    It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/M/Si trilayer ( M=Fe , W), forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone.

  7. Electron beam and optical depth profiling of quasibulk GaN

    International Nuclear Information System (INIS)

    Chernyak, L.; Osinsky, A.; Nootz, G.; Schulte, A.; Jasinski, J.; Benamara, M.; Liliental-Weber, Z.; Look, D. C.; Molnar, R. J.

    2000-01-01

    Electron beam and optical depth profiling of thick (5.5--64 μm) quasibulk n-type GaN samples, grown by hydride vapor-phase epitaxy, were carried out using electron beam induced current (EBIC), microphotoluminescence (PL), and transmission electron microscopy (TEM). The minority carrier diffusion length, L, was found to increase linearly from 0.25 μm, at a distance of about 5 μm from the GaN/sapphire interface, to 0.63 μm at the GaN surface, for a 36-μm-thick sample. The increase in L was accompanied by a corresponding increase in PL band-to-band radiative transition intensity as a function of distance from the GaN/sapphire interface. We attribute the latter changes in PL intensity and minority carrier diffusion length to a reduced carrier mobility and lifetime at the interface, due to scattering at threading dislocations. The results of EBIC and PL measurements are in good agreement with the values for dislocation density obtained using TEM

  8. Depth Profiling (ICP-MS Study of Toxic Metal Buildup in Concrete Matrices: Potential Environmental Impact

    Directory of Open Access Journals (Sweden)

    Ghada Bassioni

    2010-10-01

    Full Text Available This paper explores the potential of concrete material to accumulate toxic trace elements using ablative laser technology (ICP-MS. Concrete existing in offshore structures submerged in seawater acts as a sink for hazardous metals, which could be gradually released into the ocean creating pollution and anoxic conditions for marine life. Ablative laser technology is a valuable tool for depth profiling concrete to evaluate the distribution of toxic metals and locate internal areas where such metals accumulate. Upon rapid degradation of concrete these “hotspots” could be suddenly released, thus posing a distinct threat to aquatic life. Our work simulated offshore drilling conditions by immersing concrete blocks in seawater and investigating accumulated toxic trace metals (As, Be, Cd, Hg, Os, Pb in cored samples by laser ablation. The experimental results showed distinct inhomogeneity in metal distribution. The data suggest that conditions within the concrete structure are favorable for random metal accumulation at certain points. The exact mechanism for this behavior is not clear at this stage and has considerable scope for extended research including modeling and remedial studies.

  9. Semi-analytic techniques for calculating bubble wall profiles

    International Nuclear Information System (INIS)

    Akula, Sujeet; Balazs, Csaba; White, Graham A.

    2016-01-01

    We present semi-analytic techniques for finding bubble wall profiles during first order phase transitions with multiple scalar fields. Our method involves reducing the problem to an equation with a single field, finding an approximate analytic solution and perturbing around it. The perturbations can be written in a semi-analytic form. We assert that our technique lacks convergence problems and demonstrate the speed of convergence on an example potential. (orig.)

  10. Depth-Sizing Technique for Crack Indications in Steam Generator Tubing

    International Nuclear Information System (INIS)

    Cho, Chan Hee; Lee, Hee Jeong; Kim, Hong Deok

    2009-01-01

    The nuclear power plants have been safely operated by plugging the steam generator tubes which have the crack indications. Tube rupture events can occur if analysts fail to detect crack indications during in-service inspection. There are various types of crack indication in steam generator tubes and they have been detected by the eddy current test. The integrity assessment should be performed using the crack-sizing results from eddy current data when the crack indication is detected. However, it is not easy to evaluate the crack-depth precisely and consistently due to the complexity of the methods. The current crack-sizing methods were reviewed in this paper and the suitable ones were selected through the laboratory tests. The retired steam generators of Kori Unit 1 were used for this study. The round robin tests by the domestic qualified analysts were carried out and the statistical models were introduced to establish the appropriate depth-sizing techniques. It is expected that the proposed techniques in this study can be utilized in the Steam Generator Management Program

  11. Arabian Sea GEOSECS stations revisited: Tracer-depth profiles reveal temporal variations?

    International Nuclear Information System (INIS)

    Mulsow, S.; Povinec, P.P.; Somayajulu, B.L.K.

    2002-01-01

    In March-April 1998, the Physical Research Laboratory and the Regional Research Laboratory (Ahmedabad, India) together with the IAEA Marine Environment Laboratory, Monaco, participated in the research mission to visit GEOSECS (Geochemical Ocean Sections Study) stations in the Arabian Sea. The main objective was to reoccupy these stations which were sampled in the early seventies to observe possible time variations in trace behaviour in this region. It is generally accepted that both natural (climate variations) and anthropogenic (greenhouse effect) changes can cause modifications of the oceanic characteristics and properties of deep waters on yearly and decadal scales. For long time-scales (100 to 1000 years) one needs to look at the sediments where these changes are subtly recorded. Tracers such as 14 C and 3 H (deep waters) and 228 Ra surface waters are useful markers of water circulation patterns and changes. Also man-made radiotracers such as 90 Sr, 137 Cs, 99 Tc, 238 Pu, 239 , 240 Pu and 241 Am, can give information on air-sea exchange as well as penetration (vertical change) rates in the open ocean [2]. We visited GEOSECS stations 415 to 419. In each station, CTD profiles, 3 H, 14 C, 90 Sr, 137 Cs, Pu and Am profiles, nutrients, Be, TOC and oxygen were determined from surface to bottom. Also uranium and trace elements were sampled in function of the oxygen minimum zone. In this paper we report the findings on the physical properties as well as the variations in water circulation patterns and also vertical exchange rates in the Arabian Sea. PSU profiles collected in this mission compared with those PSU profiles measured in 1974 (GEOSECS) showed marked differences in those stations located in the southeast part of the Arabian Sea. In contrast, those located more towards the north (415-416) showed little temporal variation. We think these changes may be real given that the PSU values at depth are comparable and reflect the presence of deep Antarctic bottom

  12. Buoyancy frequency profiles and internal semidiurnal tide turning depths in the oceans

    NARCIS (Netherlands)

    King, B.; Stone, M.; Zhang, H.P.; Gerkema, T.; Marder, M.; Scott, R.B.; Swinney, H.L.

    2012-01-01

    We examine the possible existence of internal gravity wave "turning depths," depths below which the local buoyancy frequency N(z) becomes smaller than the wave frequency. At a turning depth, incident gravity waves reflect rather than reaching the ocean bottom as is generally assumed. Here we

  13. Measurements of europium-152 depth profile of stone embankments exposed the Nagasaki atomic bomb for neutron spectrum analysis

    International Nuclear Information System (INIS)

    Tatsumi-Miyajima, Junko; Shimasaki, Tatsuya; Okajima, Shunzo; Takada, Jitsuya; Yoshida, Masahiro; Takao, Hideaki; Okumura, Yutaka; Nakazawa, Masaharu.

    1990-01-01

    Quantitative measurement of neutron-induced radionuclide of 152 Eu in rocks near the hypocenter (ground center of the atomic bomb explosion) in Nagasaki was performed to obtain the depth profiles and calculate the neutron energy spectrum. Core samples were drilled and taken from the stone embankments on both sides of river within a radius of 500 m from the hypocenter. After cutting each core into about 27 mm-thick sections, each section was measured its gamma-ray spectrum with a pure germanium semiconductor detector and analyzed a content of natural europium by the activation method. The highest value 8.0 x 10 -2 Bq/μg of 152 Eu at the time of the blast was obtained from the surface plates of rock cores collected near the hypocenter. The surface activity of cores was reduced with increasing the slant distances from the hypocenter. The slopes of the depth profiles were similar among samples taken from the same location. In order to analyze the depth profile of 152 Eu activity in rock andesite, experiments using a fast neutron reactor and thermal neutron reactor were carried out. Comparing the measurements on the A-bomb exposure rock with the simulated results at the reactors, among the experiments, the depth profile using the neutron moderator of 10 mm polyethylene was closed to that obtained from the A-bomb exposed samples. The experiment of thermal neutron incidence only could not reproduce the profiles from the A-bomb exposed samples. This fact indicates that the depth profiles of 152 Eu in rock exposed to the A-bomb include valuable information concerning the neutron spectrum and intensity. (author)

  14. Novel geochemical techniques integrated in exploration for uranium deposits at depth

    International Nuclear Information System (INIS)

    Kyser, K.

    2014-01-01

    Mineral deposits are in fact geochemical anomalies, and as such their detection and assessment of their impact on the environment should be facilitated using geochemical techniques. Although geochemistry has been used directly in the discovery of uranium deposits and more indirectly in shaping deposit models, the novel applications of geochemistry and integration with other data can be more effective in formulating exploration and remediation strategies. Recent research on the use of geochemistry in detecting uranium deposits at depth include: (1) more effective integration of geochemical with geophysical data to refine targets, (2) revealing element distributions in and around deposits to adequately assess the total chemical environment associated with the deposit, (3) the use of element tracing using elemental concentrations and isotopic compositions in the near surface environment to detect specific components that have migrated to the surface from uranium deposits at depth, (4) understand the effects of both macro- and micro-environments on element mobility across the geosphere-biosphere interface to enhance exploration using select media for uranium at depth. Geophysical data used in exploration can identify areas of conductors where redox contrasts may host mineralization, structures that act to focus fluids during formation of the deposits and act as conduits for element migration to the surface, and contrasts in geology that are required for the deposits. However, precision of these data is greatly diminished with depth, but geochemical data from drill core or surface media can enhance target identification when integrated with geophysical data. Geochemical orientation surveys over known unconformity-related deposits at depth clearly identify mineralization 900m deep. Drill core near the deposit, clay-size fractions separated from soil horizons and vegetation over and far from the deposit record element migration from the deposit as radiogenic He, Rn and Pb

  15. Excess carrier depths profiles in Cu(In,Ga)(S,Se){sub 2} absorbers from spectral photoluminescence

    Energy Technology Data Exchange (ETDEWEB)

    Koenne, Nils; Knabe, Sebastian; Bauer, Gottfried H. [Institute of Physics, CvO University Oldenburg (Germany); Witte, Wolfram; Hariskos, Dimitrios [Zentrum fuer Sonnenenergie- und Wasserstoff-Forschung Baden-Wuerttemberg (ZSW), Stuttgart (Germany); Meeder, Alexander [SULFURCELL Solartechnik GmbH, Berlin (Germany)

    2011-07-01

    The polycrystalline structure of chalcopyrite absorbers, such as Cu(In,Ga)(S,Se){sub 2} and their complex metallurgical composition results in lateral and depth dependent inhomogeneities. The spectral photoluminescence (PL) recorded from front and rear side of these chalcopyrite thin-film systems shows a distinct different behavior in particular of the high energy PL-wing which is strongly governed by absorption/emission approaching unity, as well as by re-absorption of emitted PL-photons and their depth dependent origin, say excess carrier depth profile. We define a contrast parameter for the high energy PL-yield of the fluxes recorded from front side and rear side and we proof the origin of the experimental contrast with numerical simulations of spectral PL-yields via Planck's generalized law for different depth profiles of excess carriers and band gap/absorption coefficients. By comparison of experimental contrast parameters with results from numerical simulations we conclude a set of regimes of realistic combinations of depth profiles for excess carriers and band gaps.

  16. Nanometric resolution in glow discharge optical emission spectroscopy and Rutherford backscattering spectrometry depth profiling of metal (Cr, Al) nitride multilayers

    International Nuclear Information System (INIS)

    Escobar Galindo, R.; Gago, R.; Fornies, E.; Munoz-Martin, A.; Climent Font, A.; Albella, J.M.

    2006-01-01

    In this work, we address the capability of glow discharge optical emission spectroscopy (GDOES) for fast and accurate depth profiling of multilayer nitride coatings down to the nanometer range. This is shown by resolving the particular case of CrN/AlN structures with individual thickness ranging from hundreds to few nanometers. In order to discriminate and identify artefacts in the GDOES depth profile due to the sputtering process, the layered structures were verified by Rutherford backscattering spectrometry (RBS) and scanning electron microscopy (SEM). The interfaces in the GDOES profiles for CrN/AlN structures are sharper than the ones measured for similar metal multilayers due to the lower sputtering rate of the nitrides. However, as a consequence of the crater shape, there is a linear degradation of the depth resolution with depth (approximately 40 nm/μm), saturating at a value of approximately half the thickness of the thinner layer. This limit is imposed by the simultaneous sputtering of consecutive layers. The ultimate GDOES depth resolution at the near surface region was estimated to be of 4-6 nm

  17. Depth-kymography of vocal fold vibrations : part II. Simulations and direct comparisons with 3D profile measurements

    NARCIS (Netherlands)

    de Mul, Frits F. M.; George, Nibu A.; Qiu, Qingjun; Rakhorst, Gerhard; Schutte, Harm K.

    2009-01-01

    We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is

  18. Tailoring the stress-depth profile in thin films; the case of γ'-Fe4N1-x

    International Nuclear Information System (INIS)

    Wohlschloegel, M.; Welzel, U.; Mittemeijer, E.J.

    2011-01-01

    Homogeneous γ'-Fe 4 N 1-x thin films were produced by gas through-nitriding of iron thin films (thickness 800 nm) deposited onto Al 2 O 3 substrates by Molecular Beam Epitaxy. The nitriding parameters were chosen such that the nitrogen concentration within the γ' thin films was considerably lower (x ∼ 0.05) than the stoichiometric value (x = 0). X-ray diffraction stress analysis at constant penetration depths performed after the nitriding step revealed the presence of tensile stress parallel to the surface; the tensile stress was shown to be practically constant over the entire film thickness. For further nitriding treatments, the parameters were adjusted such that nitrogen enrichment occurred near the specimen surface. The depth-dependent nitrogen enrichment could be monitored by evaluating the strain-free lattice parameter of γ' as a function of X-ray penetration depth and relating it to the nitrogen concentration employing a direct relation between lattice parameter and nitrogen concentration. The small compositional variations led to distinct characteristic stress-depth profiles. The stress changes non-monotonously with depth in the film as could be shown by non-destructive X-ray diffraction stress analysis at constant penetration depths. This work demonstrates that by a specific choice of a first and a subsequent nitriding treatment (employing different nitriding potentials and/or different temperatures for both treatments) controlled development of residual stress profiles is possible in thin iron-nitride surface layers.

  19. Electron sterilization validation techniques using the controlled depth of sterilization process

    International Nuclear Information System (INIS)

    Cleghorn, D.A.; Nablo, S.V.

    1990-01-01

    Many pharmaceutical products, especially parenteral drugs, cannot be sterilized with gamma rays or high energy electrons due to the concomitant product degradation. In view of the well-controlled electron energy spectrum available in modern electron processors, it is practical to deliver sterilizing doses over depths considerably less than those defining the thickness of blister-pack constructions or pharmaceutical containers. Because bremsstrahlung and X-ray production are minimized at these low electron energies and in these low Z materials, very high electron: penetrating X-ray dose ratios are possible for the application of the technique. Thin film dosimetric techniques have been developed utilizing radiochromic film in the 10-60 g/m 2 range for determining the surface dose distribution in occluded surface areas where direct electron illumination is not possible. Procedures for validation of the process using dried spore inoculum on the product as well as in good geometry are employed to determine the process lethality and its dependence on product surface geometry. Applications of the process to labile pharmaceuticals in glass and polystyrene syringes are reviewed. It has been applied to the sterilization of commercial sterile products since 1987, and the advantages and the natural limitations of the technique are discussed. (author)

  20. Recent changes in Red Lake (Romania) sedimentation rate determined from depth profiles of 210Pb and 137Cs radioisotopes.

    Science.gov (United States)

    Begy, R; Cosma, C; Timar, A

    2009-08-01

    This work presents a first estimation of the sedimentation rate for the Red Lake (Romania). The sediment accumulation rates were determined by two well-known methods for recent sediment dating: (210)Pb and (137)Cs methods. Both techniques implied used the gamma emission of the above-mentioned radionuclides. The (210)Pb and (137)Cs concentrations in the sediment were measured using a gamma spectrometer with a HpGe detector, Gamma-X type. Activities ranging from 41+/-7 to 135+/-34Bq/kg were found for (210)Pb and from 3+/-0.5 to 1054+/-150Bq/kg for (137)Cs. The sediment profile indicates acceleration in sedimentation rate in the last 18 years. Thus, the sedimentation process for the Red Lake can be divided in two periods, the last 18 years, and respectively, the period before that. Using the Constant Rate of (210)Pb Supply method values between 0.18+/-0.04 and 1.85+/-0.5g/cm(2) year (0.32+/-0.08 and 2.83+/-0.7cm/year) were obtained. Considering both periods, an average sedimentation rate of 0.87+/-0.17g/cm(2) year (1.17cm/year) was calculated. Considering an average depth of 5.41m for the lake and the sedimentation rate estimated for the last 18 years, it could be estimated that the lake will disappear in 195 years.

  1. Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

    Science.gov (United States)

    Peters, Katharina; Raupp, Sebastian; Hummel, Helga; Bruns, Michael; Scharfer, Philip; Schabel, Wilhelm

    2016-06-01

    Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs). Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N'-Di(1-naphthyl)-N,N'-diphenyl-(1,1'-biphenyl)-4,4'-diamine) and BAlq (Bis(8-hdroxy-2methylquinoline)-(4-phenylphenoxy)aluminum), originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

  2. Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

    Directory of Open Access Journals (Sweden)

    Katharina Peters

    2016-06-01

    Full Text Available Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs. Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N’-Di(1-naphthyl-N,N’-diphenyl-(1,1’-biphenyl-4,4’-diamine and BAlq (Bis(8-hdroxy-2methylquinoline-(4-phenylphenoxyaluminum, originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

  3. Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

    Energy Technology Data Exchange (ETDEWEB)

    Peters, Katharina; Raupp, Sebastian, E-mail: sebastian.raupp@kit.edu; Scharfer, Philip; Schabel, Wilhelm [Institute of Thermal Process Engineering, Thin Film Technology, Karlsruhe Institute of Technology (KIT), Karlsruhe (Germany); Hummel, Helga [Philips Technologie GmbH Innovative Technologies, Aachen (Germany); Bruns, Michael [Institute for Applied Materials and Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), Karlsruhe (Germany)

    2016-06-15

    Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs). Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N’-Di(1-naphthyl)-N,N’-diphenyl-(1,1’-biphenyl)-4,4’-diamine) and BAlq (Bis(8-hdroxy-2methylquinoline)-(4-phenylphenoxy)aluminum), originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

  4. An angle-resolved, wavelength-dispersive x-ray fluorescence spectrometer for depth profile analysis of ion-implanted semiconductors using synchrotron radiation

    Science.gov (United States)

    Schmitt, W.; Hormes, J.; Kuetgens, U.; Gries, W. H.

    1992-01-01

    An apparatus for angle-resolved, wavelength-dispersive x-ray fluorescence spectroscopy with synchrotron radiation has been built and tested at the beam line BN2 of the Bonn electron stretcher and accelerator (ELSA). The apparatus is to be used for nondestructive depth profile analysis of ion-implanted semiconductors as part of the multinational Versailles Project of Advanced Materials and Standards (VAMAS) project on ion-implanted reference materials. In particular, the centroid depths of depth profiles of various implants is to be determined by use of the angle-resolved signal ratio technique. First results of measurements on implants of phosphorus (100 keV, 1016 cm-2) and sulfur (200 keV, 1014 cm-2) in silicon wafers using ``white'' synchrotron radiation are presented and suggest that it should be generally possible to measure the centroid depth of an implant at dose densities as low as 1014 cm-2. Some of the apparative and technical requirements are discussed which are peculiar to the use of synchrotron radiation in general and to the use of nonmonochromatized radiation in particular.

  5. An angle-resolved, wavelength-dispersive x-ray fluorescence spectrometer for depth profile analysis of ion-implanted semiconductors using synchrotron radiation

    International Nuclear Information System (INIS)

    Schmitt, W.; Hormes, J.; Kuetgens, U.; Gries, W.H.

    1992-01-01

    An apparatus for angle-resolved, wavelength-dispersive x-ray fluorescence spectroscopy with synchrotron radiation has been built and tested at the beam line BN2 of the Bonn electron stretcher and accelerator (ELSA). The apparatus is to be used for nondestructive depth profile analysis of ion-implanted semiconductors as part of the multinational Versailles Project of Advanced Materials and Standards (VAMAS) project on ion-implanted reference materials. In particular, the centroid depths of depth profiles of various implants is to be determined by use of the angle-resolved signal ratio technique. First results of measurements on implants of phosphorus (100 keV, 10 16 cm -2 ) and sulfur (200 keV, 10 14 cm -2 ) in silicon wafers using ''white'' synchrotron radiation are presented and suggest that it should be generally possible to measure the centroid depth of an implant at dose densities as low as 10 14 cm -2 . Some of the apparative and technical requirements are discussed which are peculiar to the use of synchrotron radiation in general and to the use of nonmonochromatized radiation in particular

  6. Application of ultrasonic inspection technique for crack depth sizing on nickel based alloy weld. Part 3. Establishment of UT procedure for crack depth sizing by phased array UT

    International Nuclear Information System (INIS)

    Hirasawa, Taiji; Okada, Hisao; Fukutomi, Hiroyuki

    2012-01-01

    Recently, it is reported that the primary water stress corrosion cracking (PWSCC) was occurred at the nickel based alloy weld components such as steam generator safe end weld, reactor vessel safe end weld, and so on, in PWR. Defect detection and sizing is important in order to ensure the reliable operation and life extension of nuclear power plants. In the reactor vessel safe end weld, it was impossible to measure crack depth of PWSCC. The crack was detected in the axial direction of the safe end weld. Furthermore, the crack had some features such as shallow, large aspect ratio (ratio of crack depth and length), sharp geometry of crack tip, and so on. Therefore, development and improvement of defect detection and sizing capabilities for ultrasonic testing (UT) is required. Phased array technique was applied to nickel based alloy weld specimen with SCC cracks. From the experimental results, good accuracy of crack depth sizing by phased array UT for the inside inspection was shown. From these results, UT procedure for crack depth sizing was verified. Therefore, effectiveness of phased array UT for crack depth sizing in the nickel based alloy welds was shown. (author)

  7. Techniques for intense-proton-beam profile measurements

    International Nuclear Information System (INIS)

    Gilpatrick, J.D.

    1998-01-01

    In a collaborative effort with industry and several national laboratories, the Accelerator Production of Tritium (APT) facility and the Spallation Neutron Source (SNS) linac are presently being designed and developed at Los Alamos National Laboratory (LANL). The APT facility is planned to accelerate a 100-mA H + cw beam to 1.7 GeV and the SNS linac is planned to accelerate a 1- to 4-mA-average, H - , pulsed-beam to 1 GeV. With typical rms beam widths of 1- to 3-mm throughout much of these accelerators, the maximum average-power densities of these beams are expected to be approximately 30- and 1-MW-per-square millimeter, respectively. Such power densities are too large to use standard interceptive techniques typically used for acquisition of beam profile information. This paper summarizes the specific requirements for the beam profile measurements to be used in the APT, SNS, and the Low Energy Development Accelerator (LEDA)--a facility to verify the operation of the first 20-MeV section of APT. This paper also discusses the variety of profile measurement choices discussed at a recent high-average-current beam profile workshop held in Santa Fe, NM, and will present the present state of the design for the beam profile measurements planned for APT, SNS, and LEDA

  8. Distribution of 137Cs in benthic plants along depth profiles in the outer Puck Bay (Baltic Sea)

    International Nuclear Information System (INIS)

    Tamara Zalewska

    2012-01-01

    A study was conducted on three macroalgae species: Polysiphonia fucoides and Furcellaria lumbricalis, the species of the red algae division, and Cladophora glomerata, representing the green algae division, as well as Zostera marina, representing vascular plants. The main aim of the study was to recognize the level of 137 Cs concentrations in the plants, which could be used as a measurement of bioaccumulation efficiency in the selected macrophytes at varying depths, and in the seasonal resolution of the vegetation period: spring-summer and autumnal. The plants' biomass clearly showed seasonal variability, as did the 137 Cs concentrations in the plants. Cesium activity also changed with depth. Seasonal variability in radionuclide content in the plants, as well as the differences in its activity determined along the depth profile, were related mainly to the plant biomass and the dilution effect caused by the biomass increment and reflected the growth dynamics. P. fucoides showed much greater bioaccumulation ability at each depth as compared to C. glomerata, a green algae. Lower concentrations of 137 Cs were also identified in F. lumbricalis and in Z. marina, mostly as a result of differences in morphology and physiology. P. fucoides can be recommended as a bioindicator for the monitoring of 137 Cs contamination due to the high efficiency of bioaccumulation and the available biomass along the depth profile, as well as the occurrence throughout the entire vegetation season. (author)

  9. Dechanneling measurements of defect depth profiles and effective cross-channel distribution of misaligned atoms in ion irradiated gold

    International Nuclear Information System (INIS)

    Pronko, P.P.

    1975-01-01

    Defect depth profiles for self ion and He + irradiated gold are obtained from single and multiple scatter dechanneling analysis in single crystal gold films. Quantitative defect densities are obtained through use of atomic scattering cross sections. Integral damage profiles are extracted from the dechanneling spectra and subsequently differentiated to yield the volume concentration of defects as a function of depth. Results from the self ion irradiations suggest that incident ions produce defect distributions across depths much greater than predicted by random stopping theory. This is in agreement with TEM observations of others. Comparison of the experimental profiles is made with theoretical vacancy distributions predicted by defect diffusion in a radiation environment. Similarities are observed for the low fluence irradiations suggesting that profile characteristics may be controlled by rapid migration and loss of interstitials to the film surfaces during irradiation. Information on the across-channel distribution of misaligned atoms in the damaged films is obtained with the steady increase of transverse energy model applied to the dechanneling spectra. A predominance of slight misalignment is observed with no contribution to dechanneling coming from atoms displaced significantly close to the center of the channels. This is in keeping with what is expected for crystal distortions caused by the strain fields associated with vacancy cluster defects

  10. Dechanneling measurements of defect depth profiles and effective cross-channel distribution of misaligned atoms in ion-irradiated gold

    International Nuclear Information System (INIS)

    Pronko, P.P.

    1976-01-01

    Defect depth profiles for self-ion and He + irradiated gold are obtained from single and multiple scatter dechanneling analysis in single-crystal gold films. Quantitative defect densities are obtained through use of atomic-scattering cross sections. Integral damage profiles are extracted from the dechanneling spectra and subsequently differentiated to yield the volume concentration of defects as a function of depth. Results from the self-ion irradiations suggest that incident ions produce defect distributions across depths much greater than predicted by random stopping theory. This is in agreement with TEM observations of others. Comparison of the experimental profiles is made with theoretical vacancy distributions predicted by defect diffusion in a radiation environment. Similarities are observed for the low-fluence irradiations, suggesting that profile characteristics may be controlled by rapid migration and loss of interstitials to the film surfaces during irradiation. Information on the across-channel distribution of misaligned atoms in the damaged films is obtained with the steady increase of transverse energy model. A predominance of slight misalignment is observed with no contribution to dechanneling coming from atoms displaced significantly close to the center of the channels. This is in keeping with what is expected for crystal distortions caused by the strain fields associated with vacancy cluster defects. (Auth.)

  11. DS86 neutron dose. Monte Carlo analysis for depth profile of {sup 152}Eu activity in a large stone sample

    Energy Technology Data Exchange (ETDEWEB)

    Endo, Satoru; Hoshi, Masaharu; Takada, Jun [Hiroshima Univ. (Japan). Research Inst. for Radiation Biology and Medicine; Iwatani, Kazuo; Oka, Takamitsu; Shizuma, Kiyoshi; Imanaka, Tetsuji; Fujita, Shoichiro; Hasai, Hiromi

    1999-06-01

    The depth profile of {sup 152}Eu activity induced in a large granite stone pillar by Hiroshima atomic bomb neutrons was calculated by a Monte Carlo N-Particle Transport Code (MCNP). The pillar was on the Motoyasu Bridge, located at a distance of 132 m (WSW) from the hypocenter. It was a square column with a horizontal sectional size of 82.5 cm x 82.5 cm and height of 179 cm. Twenty-one cells from the north to south surface at the central height of the column were specified for the calculation and {sup 152}Eu activities for each cell were calculated. The incident neutron spectrum was assumed to be the angular fluence data of the Dosimetry System 1986 (DS86). The angular dependence of the spectrum was taken into account by dividing the whole solid angle into twenty-six directions. The calculated depth profile of specific activity did not agree with the measured profile. A discrepancy was found in the absolute values at each depth with a mean multiplication factor of 0.58 and also in the shape of the relative profile. The results indicated that a reassessment of the neutron energy spectrum in DS86 is required for correct dose estimation. (author)

  12. Nano-deformation behavior of silicon (100) film studied by depth sensing indentation and nanoscratch technique

    Science.gov (United States)

    Geetha, D.; Pratyank, R.; Kiran, P.

    2018-04-01

    Silicon being the most important material applied in microelectronic and photovoltaic technology, repeated investigation of the mechanical properties becomes essential. The nanoscale elastic-plastic deformation characteristics of Si (100) film were analyzed using nanoindentation and nanoscratch techniques. The hardness and elastic modulus values of the film obtained from nanoindentation tests were found to be consistent with the reported values. The load-displacement curves showed discontinuities and kinks which confirms the plastic behaviour of Si. The indentation induced plastic deformations were the consequences of the phase transformations. The critical shear stress, tensile strength and plastic zone size, of the Si film when subjected to nanoindentation were determined. The nanoscratch tests were performed to understand the tribological properties of the film. The SPM images of both the nanoindentation and nanoscratch profiles were useful in revealing the plastic character in terms of the piling up of matter in the vicinity of the dents. Conclusions were drawn in quantifying the plastic deformations and phase transformations.

  13. {sup 14}N depth profiles in Ti and Ti6Al4V nitrided by various methods, measured by nuclear reaction analysis

    Energy Technology Data Exchange (ETDEWEB)

    Vickridge, I; Trompetter, B [Institute of Geological and Nuclear Sciences Ltd., Lower Hutt (New Zealand); Brown, I [Industrial Research Ltd, Lower Hutt (New Zealand)

    1994-12-31

    Titanium alloys have desirable mechanical properties for applications in many areas, but their surface properties, such as friction coefficient, hardness, and wear and corrosion resistance often need to be enhanced. This may be accomplished by forming a thin layer of titanium nitride on the surface, by such methods as thermal nitriding, Ion Beam Assisted Deposition (IBAD), sol-gel technology, or ion implantation. Ion Beam Analysis is assuming an increasing importance for characterising the composition of the outer few microns since it is the only technique that can rapidly yield quantitative concentration depth profiles of {sup 14}N with minimal disruption of the analysed region. 8 refs., 7 figs.

  14. {sup 14}N depth profiles in Ti and Ti6Al4V nitrided by various methods, measured by nuclear reaction analysis

    Energy Technology Data Exchange (ETDEWEB)

    Vickridge, I.; Trompetter, B. [Institute of Geological and Nuclear Sciences Ltd., Lower Hutt (New Zealand); Brown, I. [Industrial Research Ltd, Lower Hutt (New Zealand)

    1993-12-31

    Titanium alloys have desirable mechanical properties for applications in many areas, but their surface properties, such as friction coefficient, hardness, and wear and corrosion resistance often need to be enhanced. This may be accomplished by forming a thin layer of titanium nitride on the surface, by such methods as thermal nitriding, Ion Beam Assisted Deposition (IBAD), sol-gel technology, or ion implantation. Ion Beam Analysis is assuming an increasing importance for characterising the composition of the outer few microns since it is the only technique that can rapidly yield quantitative concentration depth profiles of {sup 14}N with minimal disruption of the analysed region. 8 refs., 7 figs.

  15. Profiling water content in soils with TDR: Comparison with the neutron probe technique

    International Nuclear Information System (INIS)

    Laurent, J.P.

    2000-01-01

    In November 1996, at a site on the Grenoble campus a 1.2-m-long neutron access tube, a 0.8-m fibreglass Trime access tube and three sets of 1-m twin-rod TDR probes were installed. Weekly measurements were made over a 9-month period. In addition, soil samples were taken from time to time with an auger, to determine gravimetric water-contents. The soil bulk density profile was initially characterised by gammametry using a Campbell TM probe. A Troxler TM 4300 was used for the neutron-probe measurements. The TDR signals, for further processing by TDR-SSI, were logged using a Trase 2000 from Soil Moisture Equipment Corporation TM . TDR methods were employed without any special calibration of the permittivity/water-content relationship: standard internal calibrations of the devices or Topp polynomial relation were always applied. The results of all these water-content profiling methods were compared in three ways: (i) the water-content profiles were plotted directly on the same graph for different dates; (ii) all the water contents measured at all dates and all depths were plotted against a corresponding 'reference', namely neutron probe or gravimetry; (iii) water balances were calculated for each method and their respective time-profiles analysed. There was fairly good agreement among the three profiling methods, indicating that TDR is now a viable alternative to nuclear techniques for soil water-content profiling. (author)

  16. SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

    Science.gov (United States)

    Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

    2018-02-01

    A procedure has been established to define the interface position in depth profiles accurately when using secondary ion mass spectrometry and the negative secondary ions. The interface position varies strongly with the extent of the matrix effect and so depends on the secondary ion measured. Intensity profiles have been measured at both fluorenylmethyloxycarbonyl-uc(l)-pentafluorophenylalanine (FMOC) to Irganox 1010 and Irganox 1010 to FMOC interfaces for many secondary ions. These profiles show separations of the two interfaces that vary over some 10 nm depending on the secondary ion selected. The shapes of these profiles are strongly governed by matrix effects, slightly weakened by a long wavelength roughening. The matrix effects are separately measured using homogeneous, known mixtures of these two materials. Removal of the matrix and roughening effects give consistent compositional profiles for all ions that are described by an integrated exponentially modified Gaussian (EMG) profile. Use of a simple integrated Gaussian may lead to significant errors. The average interface positions in the compositional profiles are determined to standard uncertainties of 0.19 and 0.14 nm, respectively, using the integrated EMG function. Alternatively, and more simply, it is shown that interface positions and profiles may be deduced from data for several secondary ions with measured matrix factors by simply extrapolating the result to Ξ = 0. Care must be taken in quoting interface resolutions since those measured for predominantly Gaussian interfaces with Ξ above or below zero, without correction, appear significantly better than the true resolution.

  17. Assessment of Zooplankton Community Composition along a Depth Profile in the Central Red Sea

    KAUST Repository

    Pearman, John K.; Irigoien, Xabier

    2015-01-01

    community. The genus Corycaeus had a higher proportion of reads in the epipelagic zone with Pleuromamma becoming increasingly dominant with depth. No significant difference was observed in the community between night and day sampling however there was a

  18. Co-constructing stories : a participatory design technique to elicit in-depth user feedback and suggestions about design concepts

    NARCIS (Netherlands)

    Ozcelik, D.; Terken, J.M.B.

    2012-01-01

    In this paper we introduce a participatory design technique for early, formative concept evaluations to elicit in-depth user feedback and suggestions, revealing attitudes and motivations of users. The technique is motivated by the link between memories, experiences and dreams, and is based on the

  19. Measurement of damage profile in crystals by channeling technique

    International Nuclear Information System (INIS)

    Borovik, A.S.; Shipatov, E.T.

    1984-01-01

    A method of calculation of the random fraction Xsub(R)(l) in a disordered channel containing host and foreign atoms is described. According to this method dechaneling caused by single scattering as well as multiple scattering at defects is calculated taking into account positions of the self-interstitials and foreign atoms with respect to the lattice rows. The results demonstrate that the transverse energy distribution, flux peaking and, hence, Xsub(R)(l) and depth profiles of defects c(l) depend drastically on the defect position, concentration of implanted atoms, their position and the rechanneling process. The method is applied to experimental data for GaAs irradiated by He + and N-implanted Si. The obtained Xsub(R)(l) and c(l) are compared with those obtained using other methods. (author)

  20. Atomic emission spectroscopic investigations for determining depth profiles at boride layers on iron materials

    International Nuclear Information System (INIS)

    Danzer, K.; Marx, G.

    1980-01-01

    A combination of atomic emission spectroscopic surface analysis and mechanical removement of defined surface areas in layers by grinding yields information about the depth distribution of boron in iron. In addition, the evaluation with the aid of the two-dimensional variance analysis leads to statements on the homogeneous distribution within individual layers at different depth. The results obtained in this way are in agreement with those of other methods

  1. Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

    Energy Technology Data Exchange (ETDEWEB)

    Steinberger, R., E-mail: roland.steinberger@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Celedón, C.E., E-mail: carlos.celedon@usm.cl [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Departamento de Física, Universidad Técnica Federico Santa María, Valaparaíso, Casilla 110-V (Chile); Bruckner, B., E-mail: barbara.bruckner@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Roth, D., E-mail: dietmar.roth@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Duchoslav, J., E-mail: jiri.duchoslav@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Arndt, M., E-mail: martin.arndt@voestalpine.com [voestalpine Stahl GmbH, voestalpine-Straße 3, 4031 Linz (Austria); Kürnsteiner, P., E-mail: p.kuernsteiner@mpie.de [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); and others

    2017-07-31

    Highlights: • Investigation on the impact of residual gas prevailing in UHV chambers. • For some metals detrimental oxygen uptake could be observed within shortest time. • Totally different behavior was found: no changes, solely adsorption and oxidation. • The UHV residual gas may severely corrupt results obtained from depth profiling. • A well-considered data acquisition sequence is the key for reliable depth profiles. - Abstract: Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

  2. Confocal Raman Microspectroscopy: The Measurement of VX Depth Profiles in Hairless Guinea Pig Skin and the Evaluation of RSDL

    Science.gov (United States)

    2015-02-01

    USAMRICD-TR-15-01 Confocal Raman Microspectroscopy: The Measurement of VX Depth Profiles in Hairless Guinea Pig Skin and the Evaluation...5a. CONTRACT NUMBER guinea pig skin and the evaluation of RSDL 5b. GRANT NUMBER 5c. PROGRAM ELEMENT NUMBER 6. AUTHOR(S) Braue, EH...upper skin layers of hairless guinea pigs and to determine the ability of Reactive Skin Decontamination Lotion (RSDL) to remove or degrade VX from

  3. Magnitude of shear stress on the san andreas fault: implications of a stress measurement profile at shallow depth.

    Science.gov (United States)

    Zoback, M D; Roller, J C

    1979-10-26

    A profile of measurements of shear stress perpendicular to the San Andreas fault near Palmdale, California, shows a marked increase in stress with distance from the fault. The pattern suggests that shear stress on the fault increases slowly with depth and reaches a value on the order of the average stress released during earthquakes. This result has important implications for both long- and shortterm prediction of large earthquakes.

  4. Final Aperture Superposition Technique applied to fast calculation of electron output factors and depth dose curves

    International Nuclear Information System (INIS)

    Faddegon, B.A.; Villarreal-Barajas, J.E.

    2005-01-01

    The Final Aperture Superposition Technique (FAST) is described and applied to accurate, near instantaneous calculation of the relative output factor (ROF) and central axis percentage depth dose curve (PDD) for clinical electron beams used in radiotherapy. FAST is based on precalculation of dose at select points for the two extreme situations of a fully open final aperture and a final aperture with no opening (fully shielded). This technique is different than conventional superposition of dose deposition kernels: The precalculated dose is differential in position of the electron or photon at the downstream surface of the insert. The calculation for a particular aperture (x-ray jaws or MLC, insert in electron applicator) is done with superposition of the precalculated dose data, using the open field data over the open part of the aperture and the fully shielded data over the remainder. The calculation takes explicit account of all interactions in the shielded region of the aperture except the collimator effect: Particles that pass from the open part into the shielded part, or visa versa. For the clinical demonstration, FAST was compared to full Monte Carlo simulation of 10x10,2.5x2.5, and 2x8 cm 2 inserts. Dose was calculated to 0.5% precision in 0.4x0.4x0.2 cm 3 voxels, spaced at 0.2 cm depth intervals along the central axis, using detailed Monte Carlo simulation of the treatment head of a commercial linear accelerator for six different electron beams with energies of 6-21 MeV. Each simulation took several hours on a personal computer with a 1.7 Mhz processor. The calculation for the individual inserts, done with superposition, was completed in under a second on the same PC. Since simulations for the pre calculation are only performed once, higher precision and resolution can be obtained without increasing the calculation time for individual inserts. Fully shielded contributions were largest for small fields and high beam energy, at the surface, reaching a maximum

  5. Accurate stopping power determination of 15N ions for hydrogen depth profiling by a combination of ion beams and synchrotron radiation

    Science.gov (United States)

    Zier, M.; Reinholz, U.; Riesemeier, H.; Radtke, M.; Munnik, F.

    2012-02-01

    Hydrogen analysis is of particular importance in thin film technology and it is often necessary to obtain a depth profile. The method with the best depth resolution is NRA using the 6385 keV resonance of the 1H( 15N,αγ) 12C nuclear reaction. The correct quantification of the depth and concentration scales in the measured hydrogen profiles relies on accurate stopping power values. We present a method to deduce these values from a combination of two techniques: NRA and X-ray reflectometry (XRR). This method is applied to the determination of the stopping power of ˜6.4 MeV 15N ions in H-containing amorphous Si-layers (a-Si:H). Density-independent stopping powers at different H concentrations are determined by combining the results from NRA and XRR with an overall uncertainty of 3.3%, showing good agreement with SRIM values. This work shows exemplary the methodology for future evaluation of stopping powers for quality assurance in NRA.

  6. Mechanical properties of porous silicon by depth-sensing nanoindentation techniques

    International Nuclear Information System (INIS)

    Fang Zhenqian; Hu Ming; Zhang Wei; Zhang Xurui; Yang Haibo

    2009-01-01

    Porous silicon (PS) was prepared using the electrochemical corrosion method. Thermal oxidation of the as-prepared PS samples was performed at different temperatures for tuning their mechanical properties. The mechanical properties of as-prepared and oxidized PS were thoroughly investigated by depth-sensing nanoindentation techniques with the continuous stiffness measurements option. The morphology of as-prepared and oxidized PS was characterized by field emission scanning electron microscope and the effect of observed microstructure changes on the mechanical properties was discussed. It is shown that the hardness and Young's elastic modulus of as-prepared PS exhibit a strong dependence on the preparing conditions and decrease with increasing current density. In particular, the mechanical properties of oxidized PS are improved greatly compared with that of as-prepared ones and increase with increasing thermal oxidation temperature. The mechanism responsible for the mechanical property enhancement is possibly the formation of SiO 2 cladding layers encapsulating on the inner surface of the incompact sponge PS to decrease the porosity and strengthen the interconnected microstructure

  7. Cosmogenic 10Be Depth Profile in top 560 m of West Antarctic Ice Sheet Divide Ice Core

    Science.gov (United States)

    Welten, K. C.; Woodruff, T. E.; Caffee, M. W.; Edwards, R.; McConnell, J. R.; Bisiaux, M. M.; Nishiizumi, K.

    2009-12-01

    Concentrations of cosmogenic 10Be in polar ice samples are a function of variations in solar activity, geomagnetic field strength, atmospheric mixing and annual snow accumulation rates. The 10Be depth profile in ice cores also provides independent chronological markers to tie Antarctic to Greenland ice cores and to tie Holocene ice cores to the 14C dendrochronology record. We measured 10Be concentrations in 187 samples from depths of 0-560 m of the main WAIS Divide core, WDC06A. The ice samples are typically 1-2 kg and represent 2-4 m of ice, equivalent to an average temporal resolution of ~12 years, based on the preliminary age-depth scale proposed for the WDC core, (McConnell et al., in prep). Be, Al and Cl were separated using ion exchange chromatography techniques and the 10Be concentrations were measured by accelerator mass spectrometry (AMS) at PRIME lab. The 10Be concentrations range from 8.1 to 19.1 x 10^3 at/g, yielding an average of (13.1±2.1) x 10^3 at/g. Adopting an average snow accumulation rate of 20.9 cm weq/yr, as derived from the age-depth scale, this value corresponds to an average 10Be flux of (2.7±0.5) x 10^5 atoms/yr/cm2. This flux is similar to that of the Holocene part of the Siple Dome (Nishiizumi and Finkel, 2007) and Dome Fuji (Horiuchi et al. 2008) ice cores, but ~30% lower than the value of 4.0 x 10^5 atoms/yr/cm2 for GISP2 (Finkel and Nishiizumi, 1997). The periods of low solar activity, known as Oort, Wolf, Spörer, Maunder and Dalton minima, show ~20% higher 10Be concentrations/fluxes than the periods of average solar activity in the last millennium. The maximum 10Be fluxes during some of these periods of low solar activity are up to ~50% higher than average 10Be fluxes, as seen in other polar ice cores, which makes these peaks suitable as chronologic markers. We will compare the 10Be record in the WAIS Divide ice core with that in other Antarctic as well as Greenland ice cores and with the 14C treering record. Acknowledgment. This

  8. Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films

    Energy Technology Data Exchange (ETDEWEB)

    Yan, X.L.; Coetsee, E. [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Wang, J.Y., E-mail: wangjy@stu.edu.cn [Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063, Guangdong (China); Swart, H.C., E-mail: swartHC@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Terblans, J.J., E-mail: terblansjj@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa)

    2017-07-31

    Highlights: • Linear Least Square (LLS) method used to separate Ni and Cu Auger spectra. • The depth-dependent ion sputtering induced roughness was quantitatively evaluated. • The depth resolution better when profiling with dual-ion beam vs. a single-ion beam. • AES depth profiling with a lower ion energy results in a better depth resolution. - Abstract: The polycrystalline Ni/Cu multilayer thin films consisting of 8 alternating layers of Ni and Cu were deposited on a SiO{sub 2} substrate by means of electron beam evaporation in a high vacuum. Concentration-depth profiles of the as-deposited multilayered Ni/Cu thin films were determined with Auger electron spectroscopy (AES) in combination with Ar{sup +} ion sputtering, under various bombardment conditions with the samples been stationary as well as rotating in some cases. The Mixing-Roughness-Information depth (MRI) model used for the fittings of the concentration-depth profiles accounts for the interface broadening of the experimental depth profiling. The interface broadening incorporates the effects of atomic mixing, surface roughness and information depth of the Auger electrons. The roughness values extracted from the MRI model fitting of the depth profiling data agrees well with those measured by atomic force microscopy (AFM). The ion sputtering induced surface roughness during the depth profiling was accordingly quantitatively evaluated from the fitted MRI parameters with sample rotation and stationary conditions. The depth resolutions of the AES depth profiles were derived directly from the values determined by the fitting parameters in the MRI model.

  9. Condition and biochemical profile of blue mussels (Mytilus edulis L.) cultured at different depths in a cold water coastal environment

    Science.gov (United States)

    Gallardi, Daria; Mills, Terry; Donnet, Sebastien; Parrish, Christopher C.; Murray, Harry M.

    2017-08-01

    The growth and health of cultured blue mussels (Mytilus edulis) are affected by environmental conditions. Typically, culture sites are situated in sheltered areas near shore (i.e., 20 m depth) mussel culture has been growing. This study evaluated the effect of culture depth on blue mussels in a cold water coastal environment (Newfoundland, Canada). Culture depth was examined over two years from September 2012 to September 2014; mussels from three shallow water (5 m) and three deep water (15 m) sites were compared for growth and biochemical composition; culture depths were compared for temperature and chlorophyll a. Differences between the two years examined were noted, possibly due to harsh winter conditions in the second year of the experiment. In both years shallow and deep water mussels presented similar condition; in year 2 deep water mussels had a significantly better biochemical profile. Lipid and glycogen analyses showed seasonal variations, but no significant differences between shallow and deep water were noted. Fatty acid profiles showed a significantly higher content of omega-3 s (20:5ω3; EPA) and lower content of bacterial fatty acids in deep water sites in year 2. Everything considered, deep water appeared to provide a more favorable environment for mussel growth than shallow water under harsher weather conditions.

  10. Defect distribution in low-temperature molecular beam epitaxy grown Si/Si(100), improved depth profiling with monoenergetic positrons

    International Nuclear Information System (INIS)

    Szeles, C.; Asoka-Kumar, P.; Lynn, K.G.; Gossmann, H.; Unterwald, F.C.; Boone, T.

    1995-01-01

    The depth distribution of open-volume defects has been studied in Si(100) crystals grown by molecular beam epitaxy at 300 degree C by the variable-energy monoenergetic positron beam technique combined with well-controlled chemical etching. This procedure gave a 10 nm depth resolution which is a significant improvement over the inherent depth resolving power of the positron beam technique. The epitaxial layer was found to grow defect-free up to 80 nm, from the interface, where small vacancy clusters, larger than divacancies, appear. The defect density then sharply increases toward the film surface. The result clearly shows that the nucleation of small open-volume defects is a precursor state to the breakdown of epitaxy and to the evolution of an amorphous film

  11. A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

    Science.gov (United States)

    Chatterjee, Shiladitya; Singh, Bhupinder; Diwan, Anubhav; Lee, Zheng Rong; Engelhard, Mark H.; Terry, Jeff; Tolley, H. Dennis; Gallagher, Neal B.; Linford, Matthew R.

    2018-03-01

    X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are much used analytical techniques that provide information about the outermost atomic and molecular layers of materials. In this work, we discuss the application of multivariate spectral techniques, including principal component analysis (PCA) and multivariate curve resolution (MCR), to the analysis of XPS and ToF-SIMS depth profiles. Multivariate analyses often provide insight into data sets that is not easily obtained in a univariate fashion. Pattern recognition entropy (PRE), which has its roots in Shannon's information theory, is also introduced. This approach is not the same as the mutual information/entropy approaches sometimes used in data processing. A discussion of the theory of each technique is presented. PCA, MCR, and PRE are applied to four different data sets obtained from: a ToF-SIMS depth profile through ca. 100 nm of plasma polymerized C3F6 on Si, a ToF-SIMS depth profile through ca. 100 nm of plasma polymerized PNIPAM (poly (N-isopropylacrylamide)) on Si, an XPS depth profile through a film of SiO2 on Si, and an XPS depth profile through a film of Ta2O5 on Ta. PCA, MCR, and PRE reveal the presence of interfaces in the films, and often indicate that the first few scans in the depth profiles are different from those that follow. PRE and backward difference PRE provide this information in a straightforward fashion. Rises in the PRE signals at interfaces suggest greater complexity to the corresponding spectra. Results from PCA, especially for the higher principal components, were sometimes difficult to understand. MCR analyses were generally more interpretable.

  12. Novel Method for Sizing Metallic Bottom Crack Depth Using Multi-frequency Alternating Current Potential Drop Technique

    OpenAIRE

    Li Yuting; Gan Fangji; Wan Zhengjun; Liao Junbi; Li Wenqiang

    2015-01-01

    Potential drop techniques are of two types: the direct current potential drop (DCPD) technique and alternating current potential drop (ACPD) technique, and both of them are used in nondestructive testing. ACPD, as a kind of valid method in sizing metal cracks, has been applied to evaluate metal structures. However, our review of most available approaches revealed that some improvements can be done in measuring depth of metal bottom crack by means of ACPD, such as accuracy and sensitivity of s...

  13. Combining snow depth and innovative skier flow measurements in order to improve snow grooming techniques

    Science.gov (United States)

    Carmagnola, Carlo Maria; Albrecht, Stéphane; Hargoaa, Olivier

    2017-04-01

    In the last decades, ski resort managers have massively improved their snow management practices, in order to adapt their strategies to the inter-annual variability in snow conditions and to the effects of climate change. New real-time informations, such as snow depth measurements carried out on the ski slopes by grooming machines during their daily operations, have become available, allowing high saving, efficiency and optimization gains (reducing for instance the groomer fuel consumption and operation time and the need for machine-made snow production). In order to take a step forward in improving the grooming techniques, it would be necessary to keep into account also the snow erosion by skiers, which depends mostly on the snow surface properties and on the skier attendance. Today, however, most ski resort managers have only a vague idea of the evolution of the skier flows on each slope during the winter season. In this context, we have developed a new sensor (named Skiflux) able to measure the skier attendance using an infrared beam crossing the slopes. Ten Skiflux sensors have been deployed during the 2016/17 winter season at Val Thorens ski area (French Alps), covering a whole sector of the resort. A dedicated software showing the number of skier passages in real time as been developed as well. Combining this new Skiflux dataset with the snow depth measurements from grooming machines (Snowsat System) and the snow and meteorological conditions measured in-situ (Liberty System from Technoalpin), we were able to create a "real-time skiability index" accounting for the quality of the surface snow and its evolution during the day. Moreover, this new framework allowed us to improve the preparation of ski slopes, suggesting new strategies for adapting the grooming working schedule to the snow quality and the skier attendance. In the near future, this work will benefit from the advances made within the H2020 PROSNOW project ("Provision of a prediction system allowing

  14. Contribution to depth profiling by particle induced X-ray emission application to the study of zinc diffusion in AgZn alloy

    International Nuclear Information System (INIS)

    Frontier, J.P.

    1987-08-01

    A contribution of the study of the capacities of Particle Induced X-ray Emission (P.I.X.E.) for depth profiling, in the range of 1 to 10 micrometers and over, is presented here. It is shown that, in a non destructuve way, the concentration profile of a given element can be obtained, in principle, by deconvoluting the X-ray yields of this element, measured in a set of experiments in which the energy of the impinging protons, hence their range, is systematically varied. Direct deconvolution procedure, which leads to the inversion of an ill-conditionned matrix is unsuitable. So we generalized the iterative procedure previously used by Vegh to solve a similar problem. Alternatively we also used a fitting procedure of several parameters which gave us somewhat better than those of the iterative procedure. Both algorithms where applied to a set of X-ray yields induced by protons of energy between 0.45 to 2 MeV, corresponding to the first 6 micrometers of various depletion profiles of zinc in an initially homogeneous Ag-3 at % Zn annealed under vacuum. For investigation of deeper layers, a sectionning technique which consists in analysing thin film hydroxide targets by specific chemistry of tiny turning, was developped with success. Cross-reference of all the obtained profiles was made with electron microprobe determination on transverse section, and with the predictions of the theory of atomic diffusion. In addition, the possibilities of increasing the depth resolution by developping techniques either of controled sanding of the surface, or analysis of the sample is discussed [fr

  15. Do Targeted Hiring Subsidies and Profiling Techniques Reduce Unemployment?

    DEFF Research Database (Denmark)

    Jahn, Elke; Wagner, Thomas

    2008-01-01

    To reduce equilibrium unemployment targeted hiring subsidies and profiling techniques for long-term unemployed are often recommended. To analyze the effects of these two instruments, our model combines two search methods: the public employment service and random search, jobseekers choose between...... an active and a passive search strategy, while labour market policy has two options available. First, only the long-term unemployed placed by the public employment service are subsidized. Second, the subsidy is paid for each match with a long-term unemployed irrespective of the search method used. We show...

  16. Silicon diodes as an alternative to diamond detectors for depth dose curves and profile measurements of photon and electron radiation.

    Science.gov (United States)

    Scherf, Christian; Peter, Christiane; Moog, Jussi; Licher, Jörg; Kara, Eugen; Zink, Klemens; Rödel, Claus; Ramm, Ulla

    2009-08-01

    Depth dose curves and lateral dose profiles should correspond to relative dose to water in any measured point, what can be more or less satisfied with different detectors. Diamond as detector material has similar dosimetric properties like water. Silicon diodes and ionization chambers are also commonly used to acquire dose profiles. The authors compared dose profiles measured in an MP3 water phantom with a diamond detector 60003, unshielded and shielded silicon diodes 60008 and 60012 and a 0.125-cm(3) thimble chamber 233642 (PTW, Freiburg, Germany) for 6- and 25-MV photons. Electron beams of 6, 12 and 18 MeV were investigated with the diamond detector, the unshielded diode and a Markus chamber 23343. The unshielded diode revealed relative dose differences at the water surface below +10% for 6-MV and +4% for 25-MV photons compared to the diamond data. These values decreased to less than 1% within the first millimeters of water depth. The shielded diode was only required to obtain correct data of the fall-off zones for photon beams larger than 10 x 10 cm(2) because of important contributions of low-energy scattered photons. For electron radiation the largest relative dose difference of -2% was observed with the unshielded silicon diode for 6 MeV within the build-up zone. Spatial resolutions were always best with the small voluminous silicon diodes. Relative dose profiles obtained with the two silicon diodes have the same degree of accuracy as with the diamond detector.

  17. Novel Method for Sizing Metallic Bottom Crack Depth Using Multi-frequency Alternating Current Potential Drop Technique

    Science.gov (United States)

    Li, Yuting; Gan, Fangji; Wan, Zhengjun; Liao, Junbi; Li, Wenqiang

    2015-10-01

    Potential drop techniques are of two types: the direct current potential drop (DCPD) technique and alternating current potential drop (ACPD) technique, and both of them are used in nondestructive testing. ACPD, as a kind of valid method in sizing metal cracks, has been applied to evaluate metal structures. However, our review of most available approaches revealed that some improvements can be done in measuring depth of metal bottom crack by means of ACPD, such as accuracy and sensitivity of shallow crack. This paper studied a novel method which utilized the slope of voltage ratio-frequency curve to solve bottom crack depth by using a simple mathematic equation based on finite element analysis. It is found that voltage ratio varies linearly with frequency in the range of 5-15 Hz; this range is slightly higher than the equivalent frequency and lower than semi-permeable frequency. Simulation and experiment show that the novel method can measure the bottom crack depth accurately.

  18. Techniques for estimating flood-depth frequency relations for streams in West Virginia

    Science.gov (United States)

    Wiley, J.B.

    1987-01-01

    Multiple regression analyses are applied to data from 119 U.S. Geological Survey streamflow stations to develop equations that estimate baseline depth (depth of 50% flow duration) and 100-yr flood depth on unregulated streams in West Virginia. Drainage basin characteristics determined from the 100-yr flood depth analysis were used to develop 2-, 10-, 25-, 50-, and 500-yr regional flood depth equations. Two regions with distinct baseline depth equations and three regions with distinct flood depth equations are delineated. Drainage area is the most significant independent variable found in the central and northern areas of the state where mean basin elevation also is significant. The equations are applicable to any unregulated site in West Virginia where values of independent variables are within the range evaluated for the region. Examples of inapplicable sites include those in reaches below dams, within and directly upstream from bridge or culvert constrictions, within encroached reaches, in karst areas, and where streams flow through lakes or swamps. (Author 's abstract)

  19. Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

    Science.gov (United States)

    Eijt, S. W. H.; Kind, R.; Singh, S.; Schut, H.; Legerstee, W. J.; Hendrikx, R. W. A.; Svetchnikov, V. L.; Westerwaal, R. J.; Dam, B.

    2009-02-01

    We report positron depth-profiling studies on the hydrogen sorption behavior and phase evolution of Mg-based thin films. We show that the main changes in the depth profiles resulting from the hydrogenation to the respective metal hydrides are related to a clear broadening in the observed electron momentum densities in both Mg and Mg2Ni films. This shows that positron annihilation methods are capable of monitoring these metal-to-insulator transitions, which form the basis for important applications of these types of films in switchable mirror devices and hydrogen sensors in a depth-sensitive manner. Besides, some of the positrons trap at the boundaries of columnar grains in the otherwise nearly vacancy-free Mg films. The combination of positron annihilation and x-ray diffraction further shows that hydrogen loading at elevated temperatures, in the range of 480-600 K, leads to a clear Pd-Mg alloy formation of the Pd catalyst cap layer. At the highest temperatures, the hydrogenation induces a partial delamination of the ˜5 nm thin capping layer, as sensitively monitored by positron depth profiling of the fraction of ortho-positronium formed at interface with the cap layer. The delamination effectively blocks the hydrogen cycling. In Mg-Si bilayers, we investigated the reactivity upon hydrogen loading and heat treatments near 480 K, which shows that Mg2Si formation is fast relative to MgH2. The combination of positron depth profiling and transmission electron microscopy shows that hydrogenation promotes a complete conversion to Mg2Si for this destabilized metal hydride system, while a partially unreacted, Mg-rich amorphous prelayer remains on top of Mg2Si after a single heat treatment in an inert gas environment. Thin film studies indicate that the difficulty of rehydrogenation of Mg2Si is not primarily the result from slow hydrogen dissociation at surfaces, but is likely hindered by the presence of a barrier for removal of Mg from the readily formed Mg2Si.

  20. Improvement of Depth Profiling into Biotissues Using Micro Electrical Impedance Spectroscopy on a Needle with Selective Passivation.

    Science.gov (United States)

    Yun, Joho; Kim, Hyeon Woo; Lee, Jong-Hyun

    2016-12-21

    A micro electrical impedance spectroscopy (EIS)-on-a-needle for depth profiling (μEoN-DP) with a selective passivation layer (SPL) on a hypodermic needle was recently fabricated to measure the electrical impedance of biotissues along with the penetration depths. The SPL of the μEoN-DP enabled the sensing interdigitated electrodes (IDEs) to contribute predominantly to the measurement by reducing the relative influence of the connection lines on the sensor output. The discrimination capability of the μEoN-DP was verified using phosphate-buffered saline (PBS) at various concentration levels. The resistance and capacitance extracted through curve fitting were similar to those theoretically estimated based on the mixing ratio of PBS and deionized water; the maximum discrepancies were 8.02% and 1.85%, respectively. Depth profiling was conducted using four-layered porcine tissue to verify the effectiveness of the discrimination capability of the μEoN-DP. The magnitude and phase between dissimilar porcine tissues (fat and muscle) were clearly discriminated at the optimal frequency of 1 MHz. Two kinds of simulations, one with SPL and the other with complete passivation layer (CPL), were performed, and it was verified that the SPL was advantageous over CPL in the discrimination of biotissues in terms of sensor output.

  1. Improvement of Depth Profiling into Biotissues Using Micro Electrical Impedance Spectroscopy on a Needle with Selective Passivation

    Directory of Open Access Journals (Sweden)

    Joho Yun

    2016-12-01

    Full Text Available A micro electrical impedance spectroscopy (EIS-on-a-needle for depth profiling (μEoN-DP with a selective passivation layer (SPL on a hypodermic needle was recently fabricated to measure the electrical impedance of biotissues along with the penetration depths. The SPL of the μEoN-DP enabled the sensing interdigitated electrodes (IDEs to contribute predominantly to the measurement by reducing the relative influence of the connection lines on the sensor output. The discrimination capability of the μEoN-DP was verified using phosphate-buffered saline (PBS at various concentration levels. The resistance and capacitance extracted through curve fitting were similar to those theoretically estimated based on the mixing ratio of PBS and deionized water; the maximum discrepancies were 8.02% and 1.85%, respectively. Depth profiling was conducted using four-layered porcine tissue to verify the effectiveness of the discrimination capability of the μEoN-DP. The magnitude and phase between dissimilar porcine tissues (fat and muscle were clearly discriminated at the optimal frequency of 1 MHz. Two kinds of simulations, one with SPL and the other with complete passivation layer (CPL, were performed, and it was verified that the SPL was advantageous over CPL in the discrimination of biotissues in terms of sensor output.

  2. Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams

    Energy Technology Data Exchange (ETDEWEB)

    Redondo-Cubero, A., E-mail: andres.redondo@uam.es [IPFN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal); Departamento de Física Aplicada y Centro de Micro-Análisis de Materiales, Universidad Autónoma de Madrid, 28049 Madrid (Spain); Corregidor, V. [IPFN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal); Vázquez, L. [Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, 28049 Madrid (Spain); Alves, L.C. [C2TN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal)

    2015-04-01

    Using an ion microprobe, a comprehensive lateral and in-depth characterization of a single GaN-based high electron mobility transistor is carried out by means of Rutherford backscattering spectrometry (RBS) in combination with particle induced X-ray emission (PIXE). Elemental distribution was obtained for every individual section of the device (wafer, gate and source contact), identifying the basic constituents of the transistor (including the detection of the passivant layer) and checking its homogeneity. A self-consistent analysis of each individual regions of the transistor was carried out with a simultaneous fit of RBS and PIXE spectra with two different beam conditions. Following this approach, the quantification of the atomic content and the layer thicknesses was successfully achieved overcoming the mass-depth ambiguity of certain elements.

  3. The Pearson IV distribution and its application to ion implanted depth profiles

    International Nuclear Information System (INIS)

    Wilson, R.G.

    1980-01-01

    The Pearson IV distribution system is analyzed to determine the regions of validity for the values of the moments that produce convex, concave, more pointed than Gaussian, and more flat-topped than Gaussian distributions; the limits beyond which no significant change in distribution is produced; and excluded regions. These regions are illustrated in a figure that can be used to facilitate the determination of the Pearson IV moments for experimental ion implanted depth distributions. Examples are given of Pearson IV distributions to illustrate the effects of the ranges of skewness, kurtosis, and standard deviation, for both more pointed and more flat-topped than Gaussian distributions. A procedure is described for matching experimental ion implanted depth distributions to computer plotted Pearson IV modified Gaussian distributions. A few experimental curves are given to illustrate the different types of Pearson IV curves, and accuracies of moments are discussed. (author)

  4. Advanced carrier depth profiling on Si and Ge with micro four-point probe

    DEFF Research Database (Denmark)

    Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte

    2008-01-01

    In order to reach the ITRS goals for future complementary metal-oxide semiconductor technologies, there is a growing need for the accurate extraction of ultrashallow electrically active dopant (carrier) profiles. In this work, it will be illustrated that this need can be met by the micro four...

  5. Estimating the Soil Temperature Profile from a single Depth Observation: A simple Empirical Heatflow Solution

    NARCIS (Netherlands)

    Holmes, T.R.H.; Owe, M.; de Jeu, R.A.M.; Kooi, H.

    2008-01-01

    Two field data sets are used to model near-surface soil temperature profiles in a bare soil. It is shown that the commonly used solutions to the heat flow equations by Van Wijk perform well when applied at deeper soil layers, but result in large errors when applied to near surface layers, where more

  6. The novel programmable riometer for in-depth ionospheric and magnetospheric observations (PRIAMOS) using direct sampling DSP techniques

    OpenAIRE

    Dekoulis, G.; Honary, F.

    2005-01-01

    This paper describes the feasibility study and simulation results for the unique multi-frequency, multi-bandwidth, Programmable Riometer for in-depth Ionospheric And Magnetospheric ObservationS (PRIAMOS) based on direct sampling digital signal processing (DSP) techniques. This novel architecture is based on sampling the cosmic noise wavefront at the antenna. It eliminates the usage of any intermediate frequency (IF) mixer stages (-6 dB) and the noise balancing technique (-3 dB), providing a m...

  7. Depth profile distribution of Cr, Cu, Co, Ni and Pb in the sediment cores of Mumbai Harbour Bay

    International Nuclear Information System (INIS)

    Madhuparna, D.; Hemalatha, P.; Raj, Sanu S.; Jha, S.K.; Tripathi, R.M.

    2014-01-01

    Estuarine and coastal sediments act as ultimate sink for trace metals that are discharged into the aquatic environment. Sources of environmental contaminants to the coastal system are numerous and may enter the estuarine environment via a number of pathways Mumbai Harbour Bay on the western coast of India, receives low level nuclear wastes and industrial and domestic sewage waste from the surrounding dwellings. Also, the bay is extensively exploited for various other local activities. The present study was carried out in the bay sediment cores to investigate the depth profile distribution of trace element concentration. Biologically significant toxic elements such as Cr, Cu, Co, Ni and Pb were estimated in the sediment cores to find out pattern of distribution in the sediment bed to follow the accumulation of elements with respect to depth

  8. Modelling the evolution of composition-and stress-depth profiles in austenitic stainless steels during low-temperature nitriding

    DEFF Research Database (Denmark)

    Jespersen, Freja Nygaard; Hattel, Jesper Henri; Somers, Marcel A. J.

    2016-01-01

    . In the present paper solid mechanics was combined with thermodynamics and diffusion kinetics to simulate the evolution of composition-depth and stress-depth profiles resulting from nitriding. The model takes into account a composition-dependent diffusion coefficient of nitrogen in expanded austenite, short range......Nitriding of stainless steel causes a surface zone of expanded austenite, which improves the wear resistance of the stainless steel while preserving the stainless behaviour. During nitriding huge residual stresses are introduced in the treated zone, arising from the volume expansion...... that accompanies the dissolution of high nitrogen contents in expanded austenite. An intriguing phenomenon during low-temperature nitriding is that the residual stresses evoked by dissolution of nitrogen in the solid state, affect the thermodynamics and the diffusion kinetics of nitrogen dissolution...

  9. A summary report on the search for current technologies and developers to develop depth profiling/physical parameter end effectors

    International Nuclear Information System (INIS)

    Nguyen, Q.H.

    1994-01-01

    This report documents the search strategies and results for available technologies and developers to develop tank waste depth profiling/physical parameter sensors. Sources searched include worldwide research reports, technical papers, journals, private industries, and work at Westinghouse Hanford Company (WHC) at Richland site. Tank waste physical parameters of interest are: abrasiveness, compressive strength, corrosiveness, density, pH, particle size/shape, porosity, radiation, settling velocity, shear strength, shear wave velocity, tensile strength, temperature, viscosity, and viscoelasticity. A list of related articles or sources for each physical parameters is provided

  10. A summary report on the search for current technologies and developers to develop depth profiling/physical parameter end effectors

    Energy Technology Data Exchange (ETDEWEB)

    Nguyen, Q.H.

    1994-09-12

    This report documents the search strategies and results for available technologies and developers to develop tank waste depth profiling/physical parameter sensors. Sources searched include worldwide research reports, technical papers, journals, private industries, and work at Westinghouse Hanford Company (WHC) at Richland site. Tank waste physical parameters of interest are: abrasiveness, compressive strength, corrosiveness, density, pH, particle size/shape, porosity, radiation, settling velocity, shear strength, shear wave velocity, tensile strength, temperature, viscosity, and viscoelasticity. A list of related articles or sources for each physical parameters is provided.

  11. Depth Profiling of La2O3 ∕ HfO2 Stacked Dielectrics for Nanoelectronic Device Applications

    KAUST Repository

    Alshareef, Husam N.

    2011-01-03

    Nanoscale La2O3 /HfO2 dielectric stacks have been studied using high resolution Rutherford backscattering spectrometry. The measured distance of the tail-end of the La signal from the dielectric/Si interface suggests that the origin of the threshold voltage shifts and the carrier mobility degradation may not be the same. Up to 20% drop in mobility and 500 mV shift in threshold voltage was observed as the La signal reached the Si substrate. Possible reasons for these changes are proposed, aided by depth profiling and bonding analysis. © 2011 The Electrochemical Society.

  12. The national psychological/personality profile of Romanians: An in depth analysis of the regional national psychological/personality profile of Romanians

    Directory of Open Access Journals (Sweden)

    David, D.

    2015-12-01

    Full Text Available In this article we perform an in depth analysis of the national psychological/personality profile of Romanians. Following recent developments in the field (see Rentfrow et al., 2013; 2015, we study the regional national psychological/personality profile of Romanians, based on the Big Five model (i.e., NEO PI/R. Using a representative sample (N1 = 1000, we performed a cluster analysis and identified two bipolar personality profiles in the population: cluster 1, called “Factor X-”, characterized by high neuroticism and low levels of extraversion, openness, agreeableness, and conscientiousness, and cluster 2, called “Factor X+”, characterized by the opposite configuration in personality traits, low neuroticism and high levels of extraversion, openness, agreeableness, and conscientiousness. The same two cluster pattern/solution emerged in other samples (N = 2200, with other Big Five-based instruments, and by using various methods of data (e.g., direct vs. reversed item score, controlling for item desirability and cluster (i.e., with and without “running means” analyses. These two profiles are quite evenly distributed in the overall population, but also across all geographical regions. Moreover, comparing the distribution of the five personality traits, we found just few small differences between the eight geographical divisions that we used for our analysis. These results suggest that the regional national psychological/personality profile of Romania is quite homogenous. Directions for harnessing the potential of both personality profiles are presented to the reader. Other implications based on the bipolar and fractal structure of the personality profile are discussed from an interdisciplinary perspective.

  13. Depth profiling of calcifications in breast tissue using picosecond Kerr-gated Raman spectroscopy.

    Science.gov (United States)

    Baker, Rebecca; Matousek, Pavel; Ronayne, Kate Louise; Parker, Anthony William; Rogers, Keith; Stone, Nicholas

    2007-01-01

    Breast calcifications are found in both benign and malignant lesions and their composition can indicate the disease state. Calcium oxalate (dihydrate) (COD) is associated with benign lesions, however calcium hydroxyapatite (HAP) is found mainly in proliferative lesions including carcinoma. The diagnostic practices of mammography and histopathology examine the morphology of the specimen. They can not reliably distinguish between the two types of calcification, which may indicate the presence of a cancerous lesion during mammography. We demonstrate for the first time that Kerr-gated Raman spectroscopy is capable of non-destructive probing of sufficient biochemical information from calcifications buried within tissue, and this information can potentially be used as a first step in identifying the type of lesion. The method uses a picosecond pulsed laser combined with fast temporal gating of Raman scattered light to enable spectra to be collected from a specific depth within scattering media by collecting signals emerging from the sample at a given time delay following the laser pulse. Spectra characteristic of both HAP and COD were obtained at depths of up to 0.96 mm, in both chicken breast and fatty tissue; and normal and cancerous human breast by utilising different time delays. This presents great potential for the use of Raman spectroscopy as an adjunct to mammography in the early diagnosis of breast cancer.

  14. Assessment of Zooplankton Community Composition along a Depth Profile in the Central Red Sea

    KAUST Repository

    Pearman, John K.

    2015-07-17

    The composition of zooplankton in the water column has received limited attention in the main body of the Red Sea and this study investigates the change in the community both spatially and temporally across 11 stations in the central Red Sea. Using molecular methods to target the v9 region of the 18S rRNA gene a total of approximately 11.5 million reads were sequenced resulting in 2528 operational taxonomic units (OTUs) at 97% similarity. The phylum Arthropoda dominated in terms of reads accounting for on average 86.2% and 65.3% for neuston nets and vertical multinets respectively. A reduction in the number of OTUs was noticed with depth for both total metazoa and Maxillopoda whilst there was also a significant change in the composition of the Maxillopoda community. The genus Corycaeus had a higher proportion of reads in the epipelagic zone with Pleuromamma becoming increasingly dominant with depth. No significant difference was observed in the community between night and day sampling however there was a significant difference in the zooplankton community between two sampling periods separated by 10 days.

  15. Silicon diodes as an alternative to diamond detectors for depth dose curves and profile measurements of photon and electron radiation

    International Nuclear Information System (INIS)

    Scherf, Christian; Moog, Jussi; Licher, Joerg; Kara, Eugen; Roedel, Claus; Ramm, Ulla; Peter, Christiane; Zink, Klemens

    2009-01-01

    Background: Depth dose curves and lateral dose profiles should correspond to relative dose to water in any measured point, what can be more or less satisfied with different detectors. Diamond as detector material has similar dosimetric properties like water. Silicon diodes and ionization chambers are also commonly used to acquire dose profiles. Material and Methods: The authors compared dose profiles measured in an MP3 water phantom with a diamond detector 60003, unshielded and shielded silicon diodes 60008 and 60012 and a 0.125-cm 3 thimble chamber 233642 (PTW, Freiburg, Germany) for 6- and 25-MV photons. Electron beams of 6, 12 and 18 MeV were investigated with the diamond detector, the unshielded diode and a Markus chamber 23343. Results: The unshielded diode revealed relative dose differences at the water surface below +10% for 6-MV and +4% for 25-MV photons compared to the diamond data. These values decreased to less than 1% within the first millimeters of water depth. The shielded diode was only required to obtain correct data of the fall-off zones for photon beams larger than 10 x 10 cm 2 because of important contributions of low-energy scattered photons. For electron radiation the largest relative dose difference of -2% was observed with the unshielded silicon diode for 6 MeV within the build-up zone. Spatial resolutions were always best with the small voluminous silicon diodes. Conclusion: Relative dose profiles obtained with the two silicon diodes have the same degree of accuracy as with the diamond detector. (orig.)

  16. Depth profiling of laser-heated chromophores in biological tissues by pulsed photothermal radiometry

    International Nuclear Information System (INIS)

    Milner, T.E.; Goodman, D.M.; Tanenbaum, B.S.; Nelson, J.S.

    1995-01-01

    A solution method is proposed to the inverse problem of determining the unknown initial temperature distribution in a laser-exposed test material from measurements provided by infrared radiometry. A Fredholm integral equation of the first kind is derived that relates the temporal evolution of the infrared signal amplitude to the unknown initial temperature distribution in the exposed test material. The singular-value decomposition is used to demonstrate the severely ill-posed nature of the derived inverse problem. Three inversion methods are used to estimate solutions for the initial temperature distribution. A nonnegatively constrained conjugate-gradient algorithm using early termination is found superior to unconstrained inversion methods and is applied to image the depth of laser-heated chromophores in human skin. Key words: constrained conjugate gradients, ill-posed problem, infrared radiometry, laser surgery, nonnegative, singular-value decomposition

  17. In-depth characterization of prebiotic galactooligosaccharides by a combination of analytical techniques

    NARCIS (Netherlands)

    Coulier, L.; Timmermans, J.; Richard, B.; Dool, R. van den; Haaksman, I.; Klarenbeek, B.; Slaghek, T.; Dongen, W. van

    2009-01-01

    A commercial prebiotic galacto-oligosaccharide mixture (Vivinal GOS) was extensively characterized using a combination of analytical techniques. The different techniques were integrated to give complementary information on specific characteristics of the oligosaccharide mixture, ranging from global

  18. Radar Plant and Measurement Technique for Determination of the Orientation and the Depth of Buried Objects

    DEFF Research Database (Denmark)

    1999-01-01

    A plant for generation of information indicative of the depth and the orientation of an object positioned below the surface of the ground is adapted to use electromagnetic radiation emitted from and received by an antenna system associated with the plant. The plant has a transmitter and a receive...

  19. Depth Profiling of SiC Lattice Damage Using Micro-Raman Spectroscopy

    Science.gov (United States)

    2002-01-01

    can significantly change the electric behavior. Techniques like Positron Annihilation Spectroscopy [5,6] and Rutherford Backscattering/Channeling... Semiconductor Materials for Optoelectronic Applications Symposium held in Boston, Massachusetts on November 26-29, 2001. To order the complete compilation... Spectroscopy DISTRIBUTION: Approved for public release, distribution unlimited This paper is part of the following report: TITLE: Progress in

  20. Improved quantitative analysis of Cu(In,Ga)Se{sub 2} thin films using MCs{sup +}-SIMS depth profiling

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Jihye; Kim, Seon Hee; Lee, Kang-Bong; Lee, Yeonhee [Korea Institute of Science and Technology, Advanced Analysis Center, Seoul (Korea, Republic of); Min, Byoung Koun [Korea Institute of Science and Technology, Clean Energy Research Center, Seoul (Korea, Republic of)

    2014-06-15

    The chalcopyrite semiconductor, Cu(InGa)Se{sub 2} (CIGS), is popular as an absorber material for incorporation in high-efficiency photovoltaic devices because it has an appropriate band gap and a high absorption coefficient. To improve the efficiency of solar cells, many research groups have studied the quantitative characterization of the CIGS absorber layers. In this study, a compositional analysis of a CIGS thin film was performed by depth profiling in secondary ion mass spectrometry (SIMS) with MCs{sup +} (where M denotes an element from the CIGS sample) cluster ion detection, and the relative sensitivity factor of the cluster ion was calculated. The emission of MCs{sup +} ions from CIGS absorber elements, such as Cu, In, Ga, and Se, under Cs{sup +} ion bombardment was investigated using time-of-flight SIMS (TOF-SIMS) and magnetic sector SIMS. The detection of MCs{sup +} ions suppressed the matrix effects of varying concentrations of constituent elements of the CIGS thin films. The atomic concentrations of the CIGS absorber layers from the MCs{sup +}-SIMS exhibited more accurate quantification compared to those of elemental SIMS and agreed with those of inductively coupled plasma atomic emission spectrometry. Both TOF-SIMS and magnetic sector SIMS depth profiles showed a similar MCs{sup +} distribution for the CIGS thin films. (orig.)

  1. Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

    Science.gov (United States)

    Steinberger, R.; Celedón, C. E.; Bruckner, B.; Roth, D.; Duchoslav, J.; Arndt, M.; Kürnsteiner, P.; Steck, T.; Faderl, J.; Riener, C. K.; Angeli, G.; Bauer, P.; Stifter, D.

    2017-07-01

    Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

  2. A compact CMA spectrometer with axially integrated hybrid electron-ion gun for ISS, AES and sputter depth profile analysis

    International Nuclear Information System (INIS)

    Gisler, E.; Bas, E.B.

    1986-01-01

    Until now, the combined application of electrons and ions in surface analysis required two separate sources for electrons and ions with different incidence angles. The newly developed hybrid electron-ion gun, however, allows bombardment of the same sample area both with noble gas ions and with electrons coming from the same direction. By integrating such a hybrid gun axially in a cylindrical mirror energy analyser (CMA) a sensitive compact single flange spectrometer obtains for ion scattering spectroscopy (ISS), Auger electron spectroscopy (AES), and sputtering all within normal beam incidence. This concept makes accurate beam centering very easy. Additionally, the bombardment from the same direction both for sputtering and for surface analysis brings advantages in depth profiling. The scattering angle for ISS has a constant value of about 138 0 . The hybrid gun delivers typically an electron beam current of -20μA at 3keV for AES, and an ion beam current of +40 nA and +1.2μA at 2 keV for ISS and sputtering respectively. The switching time between ISS, AES, and sputtering mode is about 0.1 s. So this system is best suited for automatically controlled depth profile analysis. The design and operation of this new system will be described and some applications will be discussed. (author)

  3. Measurement and Analysis of Composition and Depth Profile of H in Amorphous Si1−xCx:H Films

    International Nuclear Information System (INIS)

    Wei, Hua; Shu-De, Yao; Kun, Wang; Zhi-Bo, Ding

    2008-01-01

    Composition in amorphous Si 1−X C x :H heteroepitaxial thin films on Si (100) by plasma enhanced chemical vapour deposition (PECVD) is analysed. The unknown x (0.45–0.57) and the depth profile of hydrogen in the thin films are characterized by Rutherford backscattering spectrum (RBS), resonance-nuclear reaction analysis (R-NRA) and elastic recoil detection (ERD), respectively. In addition, the depth profile of hydrogen in the unannealed thin films is compared to that of the annealed thin films with rapid thermal annealing (RTA) or laser spike annealing (LSA) in nitrogen atmosphere. The results indicate that the stoichiometric amorphous SiC can be produced by PECVD when the ratio of CH 4 /SiH 4 is approximately equal to 25. The content of hydrogen decreases suddenly from 35% to 1% after 1150° C annealing. RTA can reduce hydrogen in SiC films effectively than LSA. (cross-disciplinary physics and related areas of science and technology)

  4. SIMS depth profiling of rubber-tyre cord bonding layers prepared using 64Zn depleted ZnO

    International Nuclear Information System (INIS)

    Fulton, W.S.; Sykes, D.E.; Smith, G.C.

    2006-01-01

    Zinc oxide and copper/zinc sulphide layers are formed during vulcanisation and moulding of rubber to brass-coated steel tyre reinforcing cords. Previous studies have described how zinc diffuses through the rubber-brass interface to form zinc sulphide, and combines with oxygen to create zinc oxide during dezincification. The zinc is usually assumed to originate in the brass of the tyre cord, however, zinc oxide is also present in the rubber formulation. We reveal how zinc from these sources is distributed within the interfacial bonding layers, before and after heat and humidity ageing. Zinc oxide produced using 64 Zn-isotope depleted zinc was mixed in the rubber formulation in place of the natural ZnO and the zinc isotope ratios within the interfacial layers were followed by secondary ion mass spectroscopy (SIMS) depth profiling. Variations in the relative ratios of the zinc isotopes during depth profiling were measured for unaged, heat-aged and humidity-aged wire samples and in each case a relatively large proportion of the zinc incorporated into the interfacial layer as zinc sulphide was shown to have originated from ZnO in the rubber compound

  5. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago in 2013 (NCEI Accession 0161327)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  6. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago since 2013

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  7. Temperature profile and water depth data collected from HARRIOT LANE in the NW Atlantic (limit-40 W) from 20 February 1987 to 22 February 1987 (NODC Accession 8700096)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the HARRIOT LANE in the Northwest Atlantic Ocean and TOGA Area - Atlantic Ocean. Data...

  8. Temperature profile and water depth data collected from HARRIOT LANE in the NW Atlantic (limit-40 W) from 29 December 1986 to 31 December 1986 (NODC Accession 8700074)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XTB casts in the NW Atlantic Ocean from the HARRIOT LANE. Data were collected from 29 December...

  9. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Mariana Archipelago in 2014

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  10. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across American Samoa in 2015

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  11. Temperature profile and water depth data collected from TOWERS in the NE Atlantic (limit-180 W) from 06 June 1986 to 29 August 1986 (NODC Accession 8600378)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the TOWERS in the Northeast Atlantic Ocean, South China Sea, Philippine Sea, and...

  12. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Pacific Remote Island Areas since 2014

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  13. Temperature profile and water depth data collected from USS THACH using BT and XBT casts in the Persian Sea for 1987-11-21 (NODC Accession 8800016)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS THACH in the Persian Sea. Data were collected from 21 November 1987 to 21...

  14. Temperature profile and water depth data collected from COCHRANE in the South China Sea and other seas from 09 January 1987 to 22 February 1987 (NODC Accession 8700095)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the COCHRANE in the South China and other seas. Data were collected from 09 January...

  15. Depth-Profiling Electronic and Structural Properties of Cu(In,Ga)(S,Se)2 Thin-Film Solar Cell.

    Science.gov (United States)

    Chiang, Ching-Yu; Hsiao, Sheng-Wei; Wu, Pin-Jiun; Yang, Chu-Shou; Chen, Chia-Hao; Chou, Wu-Ching

    2016-09-14

    Utilizing a scanning photoelectron microscope (SPEM) and grazing-incidence X-ray powder diffraction (GIXRD), we studied the electronic band structure and the crystalline properties of the pentanary Cu(In,Ga)(S,Se)2 (CIGSSe) thin-film solar cell as a function of sample depth on measuring the thickness-gradient sample. A novel approach is proposed for studying the depth-dependent information on thin films, which can provide a gradient thickness and a wide cross-section of the sample by polishing process. The results exhibit that the CIGSSe absorber layer possesses four distinct stoichiometries. The growth mechanism of this distinctive compositional distribution formed by a two-stage process is described according to the thermodynamic reaction and the manufacturing process. On the basis of the depth-profiling results, the gradient profiles of the conduction and valence bands were constructed to elucidate the performance of the electrical properties (in this case, Voc = 620 mV, Jsc = 34.6 mA/cm(2), and η = 14.04%); the valence-band maxima (VBM) measured with a SPEM in the spectroscopic mode coincide with this band-structure model, except for a lowering of the VBM observed in the surface region of the absorber layer due to the ordered defect compound (ODC). In addition, the depth-dependent texturing X-ray diffraction pattern presents the crystalline quality and the residual stress for each depth of a thin-film device. We find that the randomly oriented grains in the bottom region of the absorber layer and the different residual stress between the underlying Mo and the absorber interface, which can deteriorate the electrical performance due to peeling-off effect. An anion interstitial defect can be observed on comparing the anion concentration of the elemental distribution with crystalline composition; a few excess sulfur atoms insert in interstitial sites at the front side of the absorber layer, whereas the interstitial selenium atoms insert at the back side.

  16. Radiometric dating of sediment core from waterwork reservoir Rozgrund and analysis of mercury concentration depth profile

    International Nuclear Information System (INIS)

    Vanek, M.

    2005-01-01

    Radioisotope dating of lake sediments combined with analysis of chemical properties of the sediment layers allow us to study the history of the human impact on nature. Undisturbed sediment layers in the core samples serve as chronicle database with information about lake ecosystem and surrounding environment in the time of deposition. A sediment core sample from the bottom of the water-work reservoir Rozgrund was collected and separated into 2 cm thick layers. Samples were analysed by HPGe spectrometry for anthropogenous Cs-137 activity. From identified peaks corresponding to nuclear tests and Chernobyl accident the sedimentation rate was calculated and the chronology of layers established. Sub-samples from each layer were prepared separately for the analysis of the Hg concentration by atomic absorption spectrometry. The results show very small variations in Hg concentrations and there is no significant trend present in the profile. (author)

  17. Quantitative Analysis of Human Pluripotency and Neural Specification by In-Depth (PhosphoProteomic Profiling

    Directory of Open Access Journals (Sweden)

    Ilyas Singec

    2016-09-01

    Full Text Available Controlled differentiation of human embryonic stem cells (hESCs can be utilized for precise analysis of cell type identities during early development. We established a highly efficient neural induction strategy and an improved analytical platform, and determined proteomic and phosphoproteomic profiles of hESCs and their specified multipotent neural stem cell derivatives (hNSCs. This quantitative dataset (nearly 13,000 proteins and 60,000 phosphorylation sites provides unique molecular insights into pluripotency and neural lineage entry. Systems-level comparative analysis of proteins (e.g., transcription factors, epigenetic regulators, kinase families, phosphorylation sites, and numerous biological pathways allowed the identification of distinct signatures in pluripotent and multipotent cells. Furthermore, as predicted by the dataset, we functionally validated an autocrine/paracrine mechanism by demonstrating that the secreted protein midkine is a regulator of neural specification. This resource is freely available to the scientific community, including a searchable website, PluriProt.

  18. Soil depth profiles and radiological assessment of natural radionuclides in forest ecosystem

    International Nuclear Information System (INIS)

    Manigandan, P.K.; Chandar Shekar, B.

    2017-01-01

    We measured the distribution of three naturally occurring radionuclides, "2"3"8U, "2"3"2Th, and "4"0K, in soil samples collected from a rainforest in the Western Ghats of India. For each surface sample, we calculated average activity concentration, outdoor terrestrial γ dose rate, annual effective dose equivalent (AEDE), and radiation hazard index. The activity concentrations of surface samples were randomly distributed over space, but differed slightly with different soil depths. The concentration of "2"3"2Th and the average terrestrial γ dose rates were slightly higher than the world averages, so slightly high γ radiation appears to be a general characteristic of the Western Ghats. However, all radiological hazard indices were within the limits proposed by the International Commission on Radiological Protection. The results reported here indicate that, except for "2"3"2Th, the naturally occurring radionuclides in the forest soils of the Western Ghats were within the ranges specified by United Nations Scientific Committee on the Effects of Atomic Radiation for undisturbed virgin soils.

  19. Low energy p-Be nuclear reactions for depth-profiling Be in alloys

    International Nuclear Information System (INIS)

    Pronko, P.P.; Okamoto, P.R.; Weidersich, H.

    1977-01-01

    Beryllium distributions within the first micron of the surface of nickel- or copper-based alloys were investigated with a 300-keV proton probe utilizing low energy nuclear reactions. Be was segregated in Ni by point defect flows to the surface of the specimen during Ni-ion bombardment of elevated temperatures. The nuclear reactions used are 9 Be(p,d) 8 Be and 9 Be(p,α) 6 Li. The deuteron and alpha groups are simultaneously observable using a standard surface barrier detector. Observations were made at a 150 0 scattering angle; a 2.5 μ mylar filter in front of the detector was used for observing the deuteron yields. The alpha group may be observed with or without the filter depending on whether counting statistics or energy resolution are the more important constraints. Significant Be segregation toward the surface was observed in specimens after irradiation at 625 0 C to 23 dpa with 3.2-MeV Ni ions. Concentrations of Be were nearly doubled within 500 A of the surface and a region depleted of Be extended below the surface layer to a depth of about 3000 A. These results are in agreement with predictions

  20. Soil depth profiles and radiological assessment of natural radionuclides in forest ecosystem

    Energy Technology Data Exchange (ETDEWEB)

    Manigandan, P.K. [Al Musanna College of Technology, Muscat (Oman); Chandar Shekar, B. [Bharathiar Univ., Coimbatore (India). Kongunadu Arts and Science College

    2017-08-01

    We measured the distribution of three naturally occurring radionuclides, {sup 238}U, {sup 232}Th, and {sup 40}K, in soil samples collected from a rainforest in the Western Ghats of India. For each surface sample, we calculated average activity concentration, outdoor terrestrial γ dose rate, annual effective dose equivalent (AEDE), and radiation hazard index. The activity concentrations of surface samples were randomly distributed over space, but differed slightly with different soil depths. The concentration of {sup 232}Th and the average terrestrial γ dose rates were slightly higher than the world averages, so slightly high γ radiation appears to be a general characteristic of the Western Ghats. However, all radiological hazard indices were within the limits proposed by the International Commission on Radiological Protection. The results reported here indicate that, except for {sup 232}Th, the naturally occurring radionuclides in the forest soils of the Western Ghats were within the ranges specified by United Nations Scientific Committee on the Effects of Atomic Radiation for undisturbed virgin soils.

  1. Depth dose curves from 90Sr+90Y clinical applicators using the thermoluminescent technique

    International Nuclear Information System (INIS)

    Antonio, Patricia L.; Caldas, Linda V.E.; Oliveira, Mercia L.

    2009-01-01

    The 90 Sr+ 90 Y beta-ray sources widely used in brachytherapy applications were developed in the 1950's. Many of these sources, called clinical applicators, are still routinely used in several Brazilian radiotherapy clinics for the treatment of superficial lesions in the skin and eyes, although they are not commercialized anymore. These applicators have to be periodically calibrated, according to international recommendations, because these sources have to be very well specified in order to reach the traceability of calibration standards. In the case of beta-ray sources, the recommended quantity is the absorbed dose rate in water at a reference distance from the source. Moreover, there are other important quantities, as the depth dose curves and the source uniformity for beta-ray plaque sources. In this work, depth dose curves were obtained and studied of five dermatological applicators, using thin thermoluminescent dosimeters of CaSO 4 :Dy and phantoms of PMMA with different thicknesses (between 1.0 mm and 5.0 mm) positioned between each applicator and the TL pellets. The depth dose curves obtained presented the expected attenuation response in PMMA, and the results were compared with data obtained for a 90 Sr+ 90 Y standard source reported by the IAEA, and they were considered satisfactory. (author)

  2. Spectrally and spatially resolved photoluminescence. Lateral fluctuations and depth profiles of Cu(In,Ga)Se2-absorbers

    International Nuclear Information System (INIS)

    Neumann, Oliver

    2013-01-01

    The aim of this thesis is the development and refinement of photoluminescence (PL) methods for inhomogeneous absorbers to identify lateral fluctuations and depth-dependent variations of spectroscopic, optical and opto-electronic properties in the submicron/micron range. The first approach deals with the spectral investigation of PL emission from the front and the rear side of an absorber, whereas the second idea is about the analysis of PL spectra from the front side of the absorber for different absorber thicknesses. Another technique for determination of depth-dependent variations are confocal PL measurements at cross sections of absorbers. The last concept pursues the study of lateral fluctuations with an optical near-field microscope on specially prepared absorbers. These four strategies are demonstrated with samples based on Cu(In,Ga)Se 2 .

  3. Physical mechanisms of thermal-diffusivity depth-profile generation in a hardened low-alloy Mn, Si, Cr, Mo steel reconstructed by photothermal radiometry

    International Nuclear Information System (INIS)

    Nicolaides, Lena; Mandelis, Andreas; Beingessner, Clare J.

    2001-01-01

    It is well established that in hardened steels thermal-diffusivity broadly anticorrelates with microhardness, allowing thermal-wave depth profilometry to be used as a tool to measure microhardness profiles. Nevertheless, the physical mechanisms for this anticorrelation have not been well understood. In this work, the thermal-diffusivity profiles of rough, hardened industrial steels were reconstructed after the elimination of roughness effects from the experimental data. Carburizing and quenching are widely used for the heat treatment of steel components, and it is important to understand their effects on thermal-diffusivity profiles. A thorough examination of the actual mechanism by which thermal-diffusivity depth profiles are affected by first carburizing and then quenching AISI-8620 steels was performed. It was concluded that the variation of thermal diffusivity with depth is dominated by the carbon concentration profile, whereas the absolute value of the thermal diffusivity is a function of microstructure. [copyright] 2001 American Institute of Physics

  4. Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling

    International Nuclear Information System (INIS)

    Kotis, L.; Gurban, S.; Pecz, B.; Menyhard, M.; Yakimova, R.

    2014-01-01

    Highlights: • The thickness of graphene grown on SiC was determined by AES depth profiling. • The AES depth profiling verified the presence of buffer layer on SiC. • The presence of unsaturated Si bonds in the buffer layer has been shown. • Using multipoint analysis thickness distribution of the graphene on the wafer was determined. - Abstract: Auger electron spectroscopy (AES) depth profiling was applied for determination of the thickness of a macroscopic size graphene sheet grown on 2 in. 6H-SiC (0 0 0 1) by sublimation epitaxy. The measured depth profile deviated from the expected exponential form showing the presence of an additional, buffer layer. The measured depth profile was compared to the simulated one which allowed the derivation of the thicknesses of the graphene and buffer layers and the Si concentration of buffer layer. It has been shown that the graphene-like buffer layer contains about 30% unsaturated Si. The depth profiling was carried out in several points (diameter 50 μm), which permitted the constructing of a thickness distribution characterizing the uniformity of the graphene sheet

  5. System and technique for retrieving depth information about a surface by projecting a composite image of modulated light patterns

    Science.gov (United States)

    Hassebrook, Laurence G. (Inventor); Lau, Daniel L. (Inventor); Guan, Chun (Inventor)

    2010-01-01

    A technique, associated system and program code, for retrieving depth information about at least one surface of an object, such as an anatomical feature. Core features include: projecting a composite image comprising a plurality of modulated structured light patterns, at the anatomical feature; capturing an image reflected from the surface; and recovering pattern information from the reflected image, for each of the modulated structured light patterns. Pattern information is preferably recovered for each modulated structured light pattern used to create the composite, by performing a demodulation of the reflected image. Reconstruction of the surface can be accomplished by using depth information from the recovered patterns to produce a depth map/mapping thereof. Each signal waveform used for the modulation of a respective structured light pattern, is distinct from each of the other signal waveforms used for the modulation of other structured light patterns of a composite image; these signal waveforms may be selected from suitable types in any combination of distinct signal waveforms, provided the waveforms used are uncorrelated with respect to each other. The depth map/mapping to be utilized in a host of applications, for example: displaying a 3-D view of the object; virtual reality user-interaction interface with a computerized device; face--or other animal feature or inanimate object--recognition and comparison techniques for security or identification purposes; and 3-D video teleconferencing/telecollaboration.

  6. Novel Geochemical Techniques Integrated In Exploration for Uranium Deposits at Depth

    International Nuclear Information System (INIS)

    Kyser, Kurt

    2014-01-01

    Recent results in the use of geochemistry in detecting deep uranium deposits: (1) Map element distributions in and around deposits to assess the total chemical environment associated with the deposit, (2) Use element tracing with isotopic compositions in surface media to detect specific components from uranium deposits at depth, (3) Capitalize on element mobility across the geosphere-biosphere interface to enhance exploration using select media, (4) Geochemical data from drill core or surface media can enhance target identification when integrated with geophysical data.

  7. Novel Method for Sizing Metallic Bottom Crack Depth Using Multi-frequency Alternating Current Potential Drop Technique

    Directory of Open Access Journals (Sweden)

    Li Yuting

    2015-10-01

    Full Text Available Potential drop techniques are of two types: the direct current potential drop (DCPD technique and alternating current potential drop (ACPD technique, and both of them are used in nondestructive testing. ACPD, as a kind of valid method in sizing metal cracks, has been applied to evaluate metal structures. However, our review of most available approaches revealed that some improvements can be done in measuring depth of metal bottom crack by means of ACPD, such as accuracy and sensitivity of shallow crack. This paper studied a novel method which utilized the slope of voltage ratio-frequency curve to solve bottom crack depth by using a simple mathematic equation based on finite element analysis. It is found that voltage ratio varies linearly with frequency in the range of 5-15 Hz; this range is slightly higher than the equivalent frequency and lower than semi-permeable frequency. Simulation and experiment show that the novel method can measure the bottom crack depth accurately.

  8. Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material

    Science.gov (United States)

    Oh, Won Jin; Jang, Jong Shik; Lee, Youn Seoung; Kim, Ansoon; Kim, Kyung Joong

    2018-02-01

    Quantitative analysis methods of multi-element alloy films were compared. The atomic fractions of Si1-xGex alloy films were measured by depth profiling analysis with secondary ion mass spectrometry (SIMS) and X-ray Photoelectron Spectroscopy (XPS). Intensity-to-composition conversion factor (ICF) was used as a mean to convert the intensities to compositions instead of the relative sensitivity factors. The ICFs were determined from a reference Si1-xGex alloy film by the conventional method, average intensity (AI) method and total number counting (TNC) method. In the case of SIMS, although the atomic fractions measured by oxygen ion beams were not quantitative due to severe matrix effect, the results by cesium ion beam were very quantitative. The quantitative analysis results by SIMS using MCs2+ ions are comparable to the results by XPS. In the case of XPS, the measurement uncertainty was highly improved by the AI method and TNC method.

  9. Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se{sub 2} thin solar cell film using laser-induced breakdown spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    In, Jung-Hwan; Kim, Chan-Kyu; Lee, Seok-Hee; Choi, Jang-Hee; Jeong, Sungho, E-mail: shjeong@gist.ac.kr

    2015-03-31

    Laser-induced breakdown spectroscopy (LIBS) is reported as a method for rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se{sub 2} (CIGS) thin film. A calibration model considering compositional grading over depth was developed and verified with test samples. The results from eight test samples showed that the average concentration of Cu, In, Ga and Se could be predicted with a root mean square error of below 1% and a relative standard deviation of also below 1%. The depth profile of each constituent element of CIGS predicted by LIBS was close to those by Auger electron spectroscopy and secondary ion mass spectrometry. The average ablation depth per pulse during depth profiling was about 100 nm. - Highlights: • LIBS was adopted for quantitative analysis of CIGS thin film. • A calibration model considering compositional grading over depth was developed. • Concentration prediction of CIGS thin film was accurate and precise. • Quantitative depth profiling by LIBS was compared with those by AES and SIMS.

  10. Bayesian inversion of a CRN depth profile to infer Quaternary erosion of the northwestern Campine Plateau (NE Belgium

    Directory of Open Access Journals (Sweden)

    E. Laloy

    2017-07-01

    Full Text Available The rate at which low-lying sandy areas in temperate regions, such as the Campine Plateau (NE Belgium, have been eroding during the Quaternary is a matter of debate. Current knowledge on the average pace of landscape evolution in the Campine area is largely based on geological inferences and modern analogies. We performed a Bayesian inversion of an in situ-produced 10Be concentration depth profile to infer the average long-term erosion rate together with two other parameters: the surface exposure age and the inherited 10Be concentration. Compared to the latest advances in probabilistic inversion of cosmogenic radionuclide (CRN data, our approach has the following two innovative components: it (1 uses Markov chain Monte Carlo (MCMC sampling and (2 accounts (under certain assumptions for the contribution of model errors to posterior uncertainty. To investigate to what extent our approach differs from the state of the art in practice, a comparison against the Bayesian inversion method implemented in the CRONUScalc program is made. Both approaches identify similar maximum a posteriori (MAP parameter values, but posterior parameter and predictive uncertainty derived using the method taken in CRONUScalc is moderately underestimated. A simple way for producing more consistent uncertainty estimates with the CRONUScalc-like method in the presence of model errors is therefore suggested. Our inferred erosion rate of 39 ± 8. 9 mm kyr−1 (1σ is relatively large in comparison with landforms that erode under comparable (paleo-climates elsewhere in the world. We evaluate this value in the light of the erodibility of the substrate and sudden base level lowering during the Middle Pleistocene. A denser sampling scheme of a two-nuclide concentration depth profile would allow for better inferred erosion rate resolution, and including more uncertain parameters in the MCMC inversion.

  11. Bayesian inversion of a CRN depth profile to infer Quaternary erosion of the northwestern Campine Plateau (NE Belgium)

    Science.gov (United States)

    Laloy, Eric; Beerten, Koen; Vanacker, Veerle; Christl, Marcus; Rogiers, Bart; Wouters, Laurent

    2017-07-01

    The rate at which low-lying sandy areas in temperate regions, such as the Campine Plateau (NE Belgium), have been eroding during the Quaternary is a matter of debate. Current knowledge on the average pace of landscape evolution in the Campine area is largely based on geological inferences and modern analogies. We performed a Bayesian inversion of an in situ-produced 10Be concentration depth profile to infer the average long-term erosion rate together with two other parameters: the surface exposure age and the inherited 10Be concentration. Compared to the latest advances in probabilistic inversion of cosmogenic radionuclide (CRN) data, our approach has the following two innovative components: it (1) uses Markov chain Monte Carlo (MCMC) sampling and (2) accounts (under certain assumptions) for the contribution of model errors to posterior uncertainty. To investigate to what extent our approach differs from the state of the art in practice, a comparison against the Bayesian inversion method implemented in the CRONUScalc program is made. Both approaches identify similar maximum a posteriori (MAP) parameter values, but posterior parameter and predictive uncertainty derived using the method taken in CRONUScalc is moderately underestimated. A simple way for producing more consistent uncertainty estimates with the CRONUScalc-like method in the presence of model errors is therefore suggested. Our inferred erosion rate of 39 ± 8. 9 mm kyr-1 (1σ) is relatively large in comparison with landforms that erode under comparable (paleo-)climates elsewhere in the world. We evaluate this value in the light of the erodibility of the substrate and sudden base level lowering during the Middle Pleistocene. A denser sampling scheme of a two-nuclide concentration depth profile would allow for better inferred erosion rate resolution, and including more uncertain parameters in the MCMC inversion.

  12. Depth-kymography of vocal fold vibrations: part II. Simulations and direct comparisons with 3D profile measurements

    Energy Technology Data Exchange (ETDEWEB)

    Mul, Frits F M de; George, Nibu A; Qiu Qingjun; Rakhorst, Gerhard; Schutte, Harm K [Department of Biomedical Engineering BMSA, Faculty of Medicine, University Medical Center Groningen UMCG, University of Groningen, PO Box 196, 9700 AD Groningen (Netherlands)], E-mail: ffm@demul.net

    2009-07-07

    We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is needed, especially when the two folds act differently, e.g. in the case of tumour growth. Recently, with our novel depth-kymographic laryngoscope, we obtained calibrated data about the horizontal and vertical positions of the visible surface of the vibrating vocal folds. In order to find relations with physical parameters such as elasticity and damping constants, we numerically simulated the horizontal and vertical positions and movements of the human vocal folds while vibrating and investigated the effect of varying several parameters on the characteristics of the phonation: the masses and their dimensions, the respective forces and pressures, and the details of the vocal tract compartments. Direct one-to-one comparison with measured 3D positions presents-for the first time-a direct means of validation of these calculations. This may start a new field in vocal folds research.

  13. Depth-kymography of vocal fold vibrations: part II. Simulations and direct comparisons with 3D profile measurements

    International Nuclear Information System (INIS)

    Mul, Frits F M de; George, Nibu A; Qiu Qingjun; Rakhorst, Gerhard; Schutte, Harm K

    2009-01-01

    We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is needed, especially when the two folds act differently, e.g. in the case of tumour growth. Recently, with our novel depth-kymographic laryngoscope, we obtained calibrated data about the horizontal and vertical positions of the visible surface of the vibrating vocal folds. In order to find relations with physical parameters such as elasticity and damping constants, we numerically simulated the horizontal and vertical positions and movements of the human vocal folds while vibrating and investigated the effect of varying several parameters on the characteristics of the phonation: the masses and their dimensions, the respective forces and pressures, and the details of the vocal tract compartments. Direct one-to-one comparison with measured 3D positions presents-for the first time-a direct means of validation of these calculations. This may start a new field in vocal folds research.

  14. Web User Profile Using XUL and Information Retrieval Techniques

    Directory of Open Access Journals (Sweden)

    Dan MUNTEANU

    2008-12-01

    Full Text Available This paper presents the importance of user profile in information retrieval, information filtering and recommender systems using explicit and implicit feedback. A Firefox extension (based on XUL used for gathering data needed to infer a web user profile and an example file with collected data are presented. Also an algorithm for creating and updating the user profile and keeping track of a fixed number k of subjects of interest is presented.

  15. Classification of protein profiles using fuzzy clustering techniques

    DEFF Research Database (Denmark)

    Karemore, Gopal; Mullick, Jhinuk B.; Sujatha, R.

    2010-01-01

     Present  study  has  brought  out  a  comparison  of PCA  and  fuzzy  clustering  techniques  in  classifying  protein profiles  (chromatogram)  of  homogenates  of  different  tissue origins:  Ovarian,  Cervix,  Oral  cancers,  which  were  acquired using HPLC–LIF (High Performance Liquid...... Chromatography- Laser   Induced   Fluorescence)   method   developed   in   our laboratory. Study includes 11 chromatogram spectra each from oral,  cervical,  ovarian  cancers  as  well  as  healthy  volunteers. Generally  multivariate  analysis  like  PCA  demands  clear  data that   is   devoid   of   day......   PCA   mapping   in   classifying   various cancers from healthy spectra with classification rate up to 95 % from  60%.  Methods  are  validated  using  various  clustering indexes   and   shows   promising   improvement   in   developing optical pathology like HPLC-LIF for early detection of various...

  16. A robust economic technique for crosswell seismic profiling. Final report

    Energy Technology Data Exchange (ETDEWEB)

    Hardage, B.A.; Simmons, J.L. Jr.

    1998-01-01

    The objective of this research program was to investigate a novel way to acquire crosswell tomographic data, that being to use a standard surface-positioned seismic energy source stationed inline with two wells that have downhole receiver arrays. This field technique differs from the traditional way that crosswell tomography is done, which requires that a downhole receiver array be in one well and that a downhole seismic source be in a second well. The purpose of the research effort was to evaluate the relative merits of the potential advantages and pitfalls of surface-source crosswell tomography, which some also refer to as twin-receiver-well crosswell tomography. The principal findings were: (1) surface-source crosswell tomography is a viable technology and can be used in appropriate reservoir conditions, (2) raypath modeling should be done to determine if the targeted interwell space is properly illuminated by surface-generated wavefields before proceeding to collect surface-source tomographic data, (3) crosswell data generated by a surface-based source are subject to a greater range of traveltime errors than are data generated by a downhole source, primarily due to shot statics caused by variable weathered layers, and (4) the accuracy and reliability of the interwell tomogram increase as more independent velocity information (sonic logs, velocity checkshots, vertical seismic profiles, downhole-source crosswell data) is available to constrain the inversion. The surface-source approach to crosswell tomography was evaluated by recording twin-receiver well data at the Texaco Borehole Test Site in Humble, Texas.

  17. A rapid technique for estimating the depth and width of a two-dimensional plate from self-potential data

    International Nuclear Information System (INIS)

    Mehanee, Salah; Smith, Paul D; Essa, Khalid S

    2011-01-01

    Rapid techniques for self-potential (SP) data interpretation are of prime importance in engineering and exploration geophysics. Parameters (e.g. depth, width) estimation of the ore bodies has also been of paramount concern in mineral prospecting. In many cases, it is useful to assume that the SP anomaly is due to an ore body of simple geometric shape and to use the data to determine its parameters. In light of this, we describe a rapid approach to determine the depth and horizontal width of a two-dimensional plate from the SP anomaly. The rationale behind the scheme proposed in this paper is that, unlike the two- (2D) and three-dimensional (3D) SP rigorous source current inversions, it does not demand a priori information about the subsurface resistivity distribution nor high computational resources. We apply the second-order moving average operator on the SP anomaly to remove the unwanted (regional) effect, represented by up to a third-order polynomial, using filters of successive window lengths. By defining a function F at a fixed window length (s) in terms of the filtered anomaly computed at two points symmetrically distributed about the origin point of the causative body, the depth (z) corresponding to each half-width (w) is estimated by solving a nonlinear equation in the form ξ(s, w, z) = 0. The estimated depths are then plotted against their corresponding half-widths on a graph representing a continuous curve for this window length. This procedure is then repeated for each available window length. The depth and half-width solution of the buried structure is read at the common intersection of these various curves. The improvement of this method over the published first-order moving average technique for SP data is demonstrated on a synthetic data set. It is then verified on noisy synthetic data, complicated structures and successfully applied to three field examples for mineral exploration and we have found that the estimated depth is in good agreement with

  18. Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy

    International Nuclear Information System (INIS)

    Wang Chuangye; Morgner, Harald

    2011-01-01

    In the current work, we first reconstructed the molar fraction-depth profiles of cation and anion near the surface of tetrabutylammonium iodide dissolved in formamide by a refined calculation procedure, based on angle resolved X-ray photoelectron spectroscopy experiments. In this calculation procedure, both the transmission functions of the core levels and the inelastic mean free paths of the photoelectrons have been taken into account. We have evaluated the partial molar volumes of surfactant and solvent by the densities of such solutions with different bulk concentrations. With those partial molar volumes, the molar concentration-depth profiles of tetrabutylammonium ion and iodide ion were determined. The surface excesses of both surfactant ions were then achieved directly by integrating these depth profiles. The anionic molar concentration-depth profiles and surface excesses have been compared with their counterparts determined by neutral impact ion scattering spectroscopy. The comparisons exhibit good agreements. Being capable of determining molar concentration-depth profiles of surfactant ions by core levels with different kinetic energies may extend the applicable range of ARXPS in investigating solution surfaces.

  19. Depth-of-interaction estimates in pixelated scintillator sensors using Monte Carlo techniques

    International Nuclear Information System (INIS)

    Sharma, Diksha; Sze, Christina; Bhandari, Harish; Nagarkar, Vivek; Badano, Aldo

    2017-01-01

    Image quality in thick scintillator detectors can be improved by minimizing parallax errors through depth-of-interaction (DOI) estimation. A novel sensor for low-energy single photon imaging having a thick, transparent, crystalline pixelated micro-columnar CsI:Tl scintillator structure has been described, with possible future application in small-animal single photon emission computed tomography (SPECT) imaging when using thicker structures under development. In order to understand the fundamental limits of this new structure, we introduce cartesianDETECT2, an open-source optical transport package that uses Monte Carlo methods to obtain estimates of DOI for improving spatial resolution of nuclear imaging applications. Optical photon paths are calculated as a function of varying simulation parameters such as columnar surface roughness, bulk, and top-surface absorption. We use scanning electron microscope images to estimate appropriate surface roughness coefficients. Simulation results are analyzed to model and establish patterns between DOI and photon scattering. The effect of varying starting locations of optical photons on the spatial response is studied. Bulk and top-surface absorption fractions were varied to investigate their effect on spatial response as a function of DOI. We investigated the accuracy of our DOI estimation model for a particular screen with various training and testing sets, and for all cases the percent error between the estimated and actual DOI over the majority of the detector thickness was ±5% with a maximum error of up to ±10% at deeper DOIs. In addition, we found that cartesianDETECT2 is computationally five times more efficient than MANTIS. Findings indicate that DOI estimates can be extracted from a double-Gaussian model of the detector response. We observed that our model predicts DOI in pixelated scintillator detectors reasonably well.

  20. A new 125I-fibrinogen technique for detection and depth localization of post-operative venous thrombosis

    International Nuclear Information System (INIS)

    Bernstein, K.

    1981-10-01

    The reliability and sensitivity of the 125 I-fibrinogen uptake test (FUT) was improved by using an equipment that allowed frequent controls of its sensitivity. A new technique the 125 I-fibrinogen-sum-coincidence method (FSC), which can be used in combination with the conventional FUT for detection deep venous thrombosis (DVT) was developed. With this new method the depths of the fibrin deposits detected by the FUT could be determined. Very good agreement was demonstrated between depth determinations of thrombi by the FSC-technique and by phlebography. The new technique permits differentiation between true DVT and superficial venous thrombosis. Altogether 354 patients subjected to gynecology surgery were studied postoperatively with the improved FUT and 65 of them had signs of lower limb DVT with this test. 41 patients with a positive FUT were investigated with the FSC-technique as well, and in 37 of them the diagnosis of DVT was confirmed. Advanced age, and malignancy were preoperative risk factors for the development of DVT whereas the method of anaesthesia (general or epidural) had no significant influence on the rate of DVT. The five-fold increase in the rate of DVT after preoperative treatment with synthetic oestrogens neccesitated a change in the preoperative administration of such drugs. The new FSC-technique offers the possibilities of both determining the true 125 I-activity in athrombosis and of following its course for several weeks. It is recommended that thrombi with a maximum net-activity >2kBq and with no sign of lysis when checked by the FSC-test should be treated. (author)

  1. Damage profile examination on ion irradiated PEEK by .SUP.6 Li doping and neutron depth profiling technique

    Czech Academy of Sciences Publication Activity Database

    Vacík, Jiří; Červená, Jarmila; Hnatowicz, Vladimír; Švorčík, V.; Kobayashi, Y.; Fink, D.; Klett, R.

    1998-01-01

    Roč. 141, - (1998), s. 216-222 ISSN 0168-583X R&D Projects: GA ČR GA202/96/0077; GA AV ČR KSK1010601 Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders Impact factor: 1.093, year: 1998

  2. Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques

    Science.gov (United States)

    Hugenschmidt, C.; Bauer, A.; Böni, P.; Ceeh, H.; Eijt, S. W. H.; Gigl, T.; Pfleiderer, C.; Piochacz, C.; Neubauer, A.; Reiner, M.; Schut, H.; Weber, J.

    2015-06-01

    Heusler compounds exhibit a wide range of different electronic ground states and are hence expected to be applicable as functional materials in novel electronic and spintronic devices. Since the growth of large and defect-free Heusler crystals is still challenging, single crystals of Fe2TiSn and Cu2MnAl were grown by the optical floating zone technique. Two positron annihilation techniques—angular correlation of annihilation radiation and Doppler broadening spectroscopy (DBS)—were applied in order to study both the electronic structure and lattice defects. Recently, we succeeded to observe clearly the anisotropy of the Fermi surface of Cu2MnAl, whereas the spectra of Fe2TiSn were disturbed by foreign phases. In order to estimate the defect concentration in different samples of Heusler compounds, the positron diffusion length was determined by DBS using a monoenergetic positron beam.

  3. Depth profile investigation of the incorporated iron atoms during Kr{sup +} ion beam sputtering on Si (001)

    Energy Technology Data Exchange (ETDEWEB)

    Khanbabaee, B., E-mail: khanbabaee@physik.uni-siegen.de [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Arezki, B.; Biermanns, A. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Cornejo, M.; Hirsch, D. [Leibniz-Institut für Oberflächenmodifizierung e. V. (IOM), Permoserstraße 15, D-04318 Leipzig (Germany); Lützenkirchen-Hecht, D. [Abteilung Physik, Bergische Universität Wuppertal, D-42097 Wuppertal (Germany); Frost, F. [Leibniz-Institut für Oberflächenmodifizierung e. V. (IOM), Permoserstraße 15, D-04318 Leipzig (Germany); Pietsch, U. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany)

    2013-01-01

    We investigate the incorporation of iron atoms during nano-patterning of Si surfaces induced by 2 keV Kr{sup +} ion beam erosion under an off-normal incidence angle of 15°. Considering the low penetration depth of the ions, we have used X-ray reflectivity (XRR) and X-ray absorption near edge spectroscopy (XANES) under grazing-incidence angles in order to determine the depth profile and phase composition of the incorporated iron atoms in the near surface region, complemented by secondary ion mass spectrometry and atomic force microscopy. XRR analysis shows the accumulation of metallic atoms within a near surface layer of a few nanometer thickness. We verify that surface pattern formation takes place only when the co-sputtered Fe concentration exceeds a certain limit. For high Fe concentration, the ripple formation is accompanied by the enhancement of Fe close to the surface, whereas no Fe enhancement is found for low Fe concentration at samples with smooth surfaces. Modeling of the measured XANES spectra reveals the appearance of different silicide phases with decreasing Fe content from the top towards the volume. - Highlights: ► We investigate the incorporation of iron atoms during nano-patterning of Si surfaces. ► Pattern formation occurs when the areal density of Fe exceeds a certain threshold. ► X-ray reflectivity shows a layering at near surface due to incorporated Fe atoms. ► It is shown that the patterning is accompanied with the appearance of Fe-rich silicide.

  4. Obsidian hydration profile measurements using a nuclear reaction technique

    Science.gov (United States)

    Lee, R.R.; Leich, D.A.; Tombrello, T.A.; Ericson, J.E.; Friedman, I.

    1974-01-01

    AMBIENT water diffuses into the exposed surfaces of obsidian, forming a hydration layer which increases in thickness with time to a maximum depth of 20-40 ??m (ref. 1), this layer being the basic foundation of obsidian dating2,3. ?? 1974 Nature Publishing Group.

  5. Depth profiles of defects in Ar-iondashirradiated steels determined by a least-squares fit of S parameters from variable-energy positron annihilation

    Science.gov (United States)

    Aruga, Takeo; Takamura, Saburo; Nakata, Kiyotomo; Ito, Yasuo

    1995-01-01

    Using a new method for reconstructing the depth profile of defects in an iondashirradiated sample by using slow positrons, the depth profiles of vacancy-type defects in 316 stainless steel samples, irradiated with 250 keV Ar ions to a dose of 7.5 × 10 19 m -2 at room temperature, have been calculated from Doppler-broadening S parameters measured as a function of positron energies up to 16 keV. Without assuming any type of shape for the defect profiles, such as Gaussian, the defect profiling is done using a least-squares fitting method. The resulting profile suggests that in as-irradiated 316 stainless steel samples with lower carbon content, the defect distribution peaks at a depth four times larger than that of the ion range. After annealing at a high temperature of 1253 K for 0.5 h, the fitted profile shows that the peak around the average ion range is highly enhanced. While in the steel added with 0.3 wt% titanium, the profile exhibits almost no peak after annealing at 1073 K. The results indicate that the radiationdashproduced vacancy clusters are stabilized by the implanted Ar atoms more effectively in the Ti-free steel than in the Ti-added steel.

  6. An in-depth stability analysis of nonuniform FDTD combined with novel local implicitization techniques

    Science.gov (United States)

    Van Londersele, Arne; De Zutter, Daniël; Vande Ginste, Dries

    2017-08-01

    This work focuses on efficient full-wave solutions of multiscale electromagnetic problems in the time domain. Three local implicitization techniques are proposed and carefully analyzed in order to relax the traditional time step limit of the Finite-Difference Time-Domain (FDTD) method on a nonuniform, staggered, tensor product grid: Newmark, Crank-Nicolson (CN) and Alternating-Direction-Implicit (ADI) implicitization. All of them are applied in preferable directions, alike Hybrid Implicit-Explicit (HIE) methods, as to limit the rank of the sparse linear systems. Both exponential and linear stability are rigorously investigated for arbitrary grid spacings and arbitrary inhomogeneous, possibly lossy, isotropic media. Numerical examples confirm the conservation of energy inside a cavity for a million iterations if the time step is chosen below the proposed, relaxed limit. Apart from the theoretical contributions, new accomplishments such as the development of the leapfrog Alternating-Direction-Hybrid-Implicit-Explicit (ADHIE) FDTD method and a less stringent Courant-like time step limit for the conventional, fully explicit FDTD method on a nonuniform grid, have immediate practical applications.

  7. Simple and fast technique to measure CO2 profiles in soil

    International Nuclear Information System (INIS)

    Fang, C.; Moncrieff, J.B.

    1998-01-01

    We describe a simple method for sampling soil gas at different profile depths and analyzing CO 2 concentration in the gas sample. Soil gas samples were taken on the soil surface from each chosen depth through a gas circulation system and analyzed in situ with an infrared gas analyzer. The method is suitable for quickly handling a large number of soil gas samples in the field. (author)

  8. Time-Domain Techniques for Computation and Reconstruction of One-Dimensional Profiles

    Directory of Open Access Journals (Sweden)

    M. Rahman

    2005-01-01

    Full Text Available This paper presents a time-domain technique to compute the electromagnetic fields and to reconstruct the permittivity profile within a one-dimensional medium of finite length. The medium is characterized by a permittivity as well as conductivity profile which vary only with depth. The discussed scattering problem is thus one-dimensional. The modeling tool is divided into two different schemes which are named as the forward solver and the inverse solver. The task of the forward solver is to compute the internal fields of the specimen which is performed by Green’s function approach. When a known electromagnetic wave is incident normally on the media, the resulting electromagnetic field within the media can be calculated by constructing a Green’s operator. This operator maps the incident field on either side of the medium to the field at an arbitrary observation point. It is nothing but a matrix of integral operators with kernels satisfying known partial differential equations. The reflection and transmission behavior of the medium is also determined from the boundary values of the Green's operator. The inverse solver is responsible for solving an inverse scattering problem by reconstructing the permittivity profile of the medium. Though it is possible to use several algorithms to solve this problem, the invariant embedding method, also known as the layer-stripping method, has been implemented here due to the advantage that it requires a finite time trace of reflection data. Here only one round trip of reflection data is used, where one round trip is defined by the time required by the pulse to propagate through the medium and back again. The inversion process begins by retrieving the reflection kernel from the reflected wave data by simply using a deconvolution technique. The rest of the task can easily be performed by applying a numerical approach to determine different profile parameters. Both the solvers have been found to have the

  9. Elemental depth profiles and plasma etching rates of positive-tone electron beam resists after sequential infiltration synthesis of alumina

    Science.gov (United States)

    Ozaki, Yuki; Ito, Shunya; Hiroshiba, Nobuya; Nakamura, Takahiro; Nakagawa, Masaru

    2018-06-01

    By scanning transmission electron microscopy and energy dispersive X-ray spectroscopy (STEM–EDS), we investigated the elemental depth profiles of organic electron beam resist films after the sequential infiltration synthesis (SIS) of inorganic alumina. Although a 40-nm-thick poly(methyl methacrylate) (PMMA) film was entirely hybridized with alumina, an uneven distribution was observed near the interface between the substrate and the resist as well as near the resist surface. The uneven distribution was observed around the center of a 100-nm-thick PMMA film. The thicknesses of the PMMA and CSAR62 resist films decreased almost linearly as functions of plasma etching period. The comparison of etching rate among oxygen reactive ion etching, C3F8 reactive ion beam etching (RIBE), and Ar ion beam milling suggested that the SIS treatment enhanced the etching resistance of the electron beam resists to chemical reactions rather than to ion collisions. We proposed oxygen- and Ar-assisted C3F8 RIBE for the fabrication of silica imprint molds by electron beam lithography.

  10. Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling

    Energy Technology Data Exchange (ETDEWEB)

    Baunack, S.; Wolff, U. [Leibniz-Institut fuer Festkoerper- und Werkstoffforschung Dresden, Postfach 270016, 01171, Dresden (Germany); Subba Rao, R.V. [Indira Ghandi Centre for Atomic Research, 603 102, Kalpakkam, Tamil Nadu (India)

    2003-04-01

    Amorphous ribbons of Mg-Y-TM-[Ag](TM: Cu, Ni), prepared by melt spinning, were subjected to electrochemical investigations. Oxide layers formed anodically under potentiostatic control in different electrolytes were investigated by AES and sputter depth profiling. Problems and specific features of characterization of the composition of oxide layers and amorphous ternary or quaternary Mg-based alloys have been investigated. In the alloys the Mg(KL{sub 23}L{sub 23}) peak exhibits a different shape compared to that in the pure element. Analysis of the peak of elastically scattered electrons proved the absence of plasmon loss features, characteristic of pure Mg, in the alloy. A different loss feature emerges in Mg(KL{sub 23}L{sub 23}) and Cu(L{sub 23}VV). The system Mg-Y-TM-[Ag] suffers preferential sputtering. Depletion of Mg and enrichment of TM and Y are found. This is attributed mainly to the preferential sputtering of Mg. Thickness and composition of the formed oxide layer depend on the electrochemical treatment. After removing the oxide by sputtering the concentration of the underlying alloy was found to be affected by the treatment. (orig.)

  11. Time Variations of Observed H α Line Profiles and Precipitation Depths of Nonthermal Electrons in a Solar Flare

    Energy Technology Data Exchange (ETDEWEB)

    Falewicz, Robert; Radziszewski, Krzysztof; Rudawy, Paweł; Berlicki, Arkadiusz, E-mail: falewicz@astro.uni.wroc.pl, E-mail: radziszewski@astro.uni.wroc.pl, E-mail: rudawy@astro.uni.wroc.pl, E-mail: berlicki@astro.uni.wroc.pl [Astronomical Institute, University of Wrocław, 51-622 Wrocław, ul. Kopernika 11 (Poland)

    2017-10-01

    We compare time variations of the H α and X-ray emissions observed during the pre-impulsive and impulsive phases of the C1.1-class solar flare on 2013 June 21 with those of plasma parameters and synthesized X-ray emission from a 1D hydrodynamic numerical model of the flare. The numerical model was calculated assuming that the external energy is delivered to the flaring loop by nonthermal electrons (NTEs). The H α spectra and images were obtained using the Multi-channel Subtractive Double Pass spectrograph with a time resolution of 50 ms. The X-ray fluxes and spectra were recorded by RHESSI . Pre-flare geometric and thermodynamic parameters of the model and the delivered energy were estimated using RHESSI data. The time variations of the X-ray light curves in various energy bands and those of the H α intensities and line profiles were well correlated. The timescales of the observed variations agree with the calculated variations of the plasma parameters in the flaring loop footpoints, reflecting the time variations of the vertical extent of the energy deposition layer. Our result shows that the fast time variations of the H α emission of the flaring kernels can be explained by momentary changes of the deposited energy flux and the variations of the penetration depths of the NTEs.

  12. Lithium diffusion in polyether ether ketone and polyimide stimulated by in situ electron irradiation and studied by the neutron depth profiling method

    Science.gov (United States)

    Vacik, J.; Hnatowicz, V.; Attar, F. M. D.; Mathakari, N. L.; Dahiwale, S. S.; Dhole, S. D.; Bhoraskar, V. N.

    2014-10-01

    Diffusion of lithium from a LiCl aqueous solution into polyether ether ketone (PEEK) and polyimide (PI) assisted by in situ irradiation with 6.5 MeV electrons was studied by the neutron depth profiling method. The number of the Li atoms was found to be roughly proportional to the diffusion time. Regardless of the diffusion time, the measured depth profiles in PEEK exhibit a nearly exponential form, indicating achievement of a steady-state phase of a diffusion-reaction process specified in the text. The form of the profiles in PI is more complex and it depends strongly on the diffusion time. For the longer diffusion time, the profile consists of near-surface bell-shaped part due to Fickian-like diffusion and deeper exponential part.

  13. Ground-Penetrating-Radar Profiles of Interior Alaska Highways: Interpretation of Stratified Fill, Frost Depths, Water Table, and Thaw Settlement over Ice-Rich Permafrost

    Science.gov (United States)

    2016-08-01

    along either massive ice surfaces or within sections of segregated ice. The uninsulated ice surface at Tok in Figure 17B is irregular. All of the...ER D C/ CR RE L TR -1 6- 14 ERDC’s Center-Directed Research Program Ground -Penetrating-Radar Profiles of Interior Alaska Highways...August 2016 Ground -Penetrating-Radar Profiles of Interior Alaska Highways Interpretation of Stratified Fill, Frost Depths, Water Table, and Thaw

  14. Highly Resolved Mg/Ca Depth Profiles of Planktic Foraminifer test Walls Using Single shot Measurements of fs-LA-ICPMS

    Science.gov (United States)

    Jochum, K. P.; Schiebel, R.; Stoll, B.; Weis, U.; Haug, G. H.

    2017-12-01

    Foraminifers are sensitive archives of changes in climate and marine environment. It has been shown that the Mg/Ca signal is a suitable proxy of seawater temperature, because the incorporation of Mg depends on ambient water temperature. In contrast to most former studies, where this ratio is determined by solution-based bulk analysis of 20 - 30 specimens, we have investigated Mg/Ca in single specimens and single chambers at high resolution. A new fs-200 nm-LA-ICPMS technique was developed for the µm-sized layered calcite shells. To generate depth profiles with a resolution of about 50 nm/shot, we chose a low fluence of about 0.3 Jcm-2 and performed single shot measurements of the double charged 44Ca++ and the single charged 25Mg+ ions together. Precision (RSD) of the Mg/Ca data is about 5 %. Calibration was performed with the carbonate reference material MACS-3 from the USGS. Our results for different species from the Arabian Sea and Caribbean Sea demonstrate that Mg/Ca of different chambers vary and indicate that the foraminifer individuals built their chambers in different water depths and/or experienced seasonal changes in seawater temperature caused, for example, by upwelling (cold) versus stratified (warm) conditions. Typically, the Mg/Ca ratios of the final two chambers of the planktic foraminifer Globorotalia menardii from a sediment core of the Arabian Sea differ by about 5 mmol/mol from earlier chambers (2 mmol/mol) corresponding to seawater temperatures of 28 °C and 18 °C, respectively. In addition, mass fractions of other elements like Sr, Mn, Fe, Ba, and U have been determined with fs-LA-ICPMS using fast line scans, and thus provide further insights in the ecology of foraminifers.

  15. The use of neutron diffraction for the determination of the in-depth residual stresses profile in weld coatings

    International Nuclear Information System (INIS)

    Marques, Maria Jose; Batista, A.C.; Nobre, J.P.; Loureiro, Altino; Kornmeier, Joana R.

    2013-01-01

    The neutron diffraction is a non-destructive technique, particularly suitable for the analysis of residual stress fields in welds. The technique is used in this article to study ferritic samples, coated by submerged arc welding using stainless steel filler metals. This procedure is often used for manufacturing process equipment for chemical and nuclear industries, for ease of implementation and economic reasons. The main disadvantage of that processes is the cracking phenomenon that often occurs at the interface between the base material and coatings, which can be minimized by performing post-weld stress relief heat treatments. The samples analyzed in this study were made of carbon steel plates, coated by submerged arc welding two types of stainless steel filler metals. For the first layer was used one EN 12 072 - S 2 U 23 12 electrode, while for the second and third layers were used an EN 12 072 - 19 12 3 S L electrode. After cladding, the samples were submitted to a post-weld heat treatment for 1 hour at 620 deg C. The residual stress profiles obtained by neutron diffraction evidence the relaxation of residual stress given by the heat treatment. (author)

  16. Depth profiling the solid electrolyte interphase on lithium titanate (Li4Ti5O12) using synchrotron-based photoelectron spectroscopy

    DEFF Research Database (Denmark)

    Nordh, Tim; Younesi, Reza; Brandell, Daniel

    2015-01-01

    The presence of a surface layer on lithium titanate (Li4Ti5O12, LTO) anodes, which has been a topic of debate in scientific literature, is here investigated with tunable high surface sensitive synchrotron-based photoelectron spectroscopy (PES) to obtain a reliable depth profile of the interphase...

  17. Lithium diffusion in polyether ether ketone and polyimide stimulated by in situ electron irradiation and studied by the neutron depth profiling method

    Czech Academy of Sciences Publication Activity Database

    Vacík, Jiří; Hnatowicz, Vladimír; Attar, F. M. D.; Mathakari, N. L.; Dahiwale, S. S.; Dhole, S. D.; Bhoraskar, V. N.

    2014-01-01

    Roč. 169, č. 10 (2014), s. 885-891 ISSN 1042-0150 R&D Projects: GA ČR(CZ) GBP108/12/G108; GA MŠk(XE) LM2011019 Institutional support: RVO:61389005 Keywords : diffusion * lithium * neutron depth profiling * polymers Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders Impact factor: 0.513, year: 2014

  18. Comparison of Decisions Quality of Heuristic Methods with Limited Depth-First Search Techniques in the Graph Shortest Path Problem

    Directory of Open Access Journals (Sweden)

    Vatutin Eduard

    2017-12-01

    Full Text Available The article deals with the problem of analysis of effectiveness of the heuristic methods with limited depth-first search techniques of decision obtaining in the test problem of getting the shortest path in graph. The article briefly describes the group of methods based on the limit of branches number of the combinatorial search tree and limit of analyzed subtree depth used to solve the problem. The methodology of comparing experimental data for the estimation of the quality of solutions based on the performing of computational experiments with samples of graphs with pseudo-random structure and selected vertices and arcs number using the BOINC platform is considered. It also shows description of obtained experimental results which allow to identify the areas of the preferable usage of selected subset of heuristic methods depending on the size of the problem and power of constraints. It is shown that the considered pair of methods is ineffective in the selected problem and significantly inferior to the quality of solutions that are provided by ant colony optimization method and its modification with combinatorial returns.

  19. Comparison of Decisions Quality of Heuristic Methods with Limited Depth-First Search Techniques in the Graph Shortest Path Problem

    Science.gov (United States)

    Vatutin, Eduard

    2017-12-01

    The article deals with the problem of analysis of effectiveness of the heuristic methods with limited depth-first search techniques of decision obtaining in the test problem of getting the shortest path in graph. The article briefly describes the group of methods based on the limit of branches number of the combinatorial search tree and limit of analyzed subtree depth used to solve the problem. The methodology of comparing experimental data for the estimation of the quality of solutions based on the performing of computational experiments with samples of graphs with pseudo-random structure and selected vertices and arcs number using the BOINC platform is considered. It also shows description of obtained experimental results which allow to identify the areas of the preferable usage of selected subset of heuristic methods depending on the size of the problem and power of constraints. It is shown that the considered pair of methods is ineffective in the selected problem and significantly inferior to the quality of solutions that are provided by ant colony optimization method and its modification with combinatorial returns.

  20. Immersion technique as a tool for in-depth OCT imaging through human blood and body's interior tissues

    Science.gov (United States)

    Xu, Xiangqun; Tuchin, Valery V.; Wang, Ruikang K.

    2001-05-01

    The concept of refractive index matching used for the enhancement of optical penetration depth of the whole blood is discussed on the basis of in vitro studies using optical coherence tomography technique. It was found that blood optical clearing is defined not only by refractive index matching effect, but also by changes of RBC size and their aggregation ability when chemicals are added. Chemical agents studied include glycerol, propylene glycol, trazograph, and dextrans. For the hyperosmotic agents, the application of 6.5% glycerol into twice diluted blood reduces the total attenuation coefficient from 4.2/mm to 2.0/mm, and correspondingly increases the optical penetration at 820 nm up to 117%. Similar effects of increase in transmittance and decrease in light scattering are also demonstrated by various molecular detrans with the light penetration enhancement within a range between 52.1% and 150.5%. We also demonstrate that the use of biocompatible agents could enhance in-depth imaging of the human esophagus and stomach tissues.

  1. Comparison of inverse Laplace and numerical inversion methods for obtaining z-depth profiles of diffraction data

    International Nuclear Information System (INIS)

    Xiaojing Zhu; Predecki, P.; Ballard, B.

    1995-01-01

    Two different inversion methods, the inverse Laplace method and the linear constrained numerical method, for retrieving the z-profiles of diffraction data from experimentally obtained i-profiles were compared using tests with a known function as the original z-profile. Two different real data situations were simulated to determine the effects of specimen thickness and missing τ-profile data at small τ-values on the retrieved z-profiles. The results indicate that although both methods are able to retrieve the z-profiles in the bulk specimens satisfactorily, the numerical method can be used for thin film samples as well. Missing τ-profile data at small τ values causes error in the retrieved z-profiles with both methods, particularly when the trend of the τ-profile at small τ is significantly changed because of the missing data. 6 refs., 3 figs

  2. Nuclear techniques for measuring moisture content in soil profiles

    International Nuclear Information System (INIS)

    Barrada, Y.

    1983-01-01

    The prevailing severe shortage of animal feed in most of the developing countries could, to a considerable extent, be overcome through improved range management, which includes introduction of high yielding drought-resistant forage crops, development of adequate water conservation measures, and as far as possible growing annual forage crops on part of the vast areas of arable land currently left fallow each year. Year round measurements are essential for a good understanding of soil water and nutrients dynamics, which allow for adequate evaluation of pasture management alternatives. The methods most commonly used for moisture measurements in soil profiles are discussed because such measurements are likely to form an essential part of any investigation aimed at increasing animal feed production through the development of adequate pasture management practices. (author)

  3. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C{sub 60}{sup +}-Ar{sup +} co-sputtering

    Energy Technology Data Exchange (ETDEWEB)

    Chang, Chi-Jen [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Chang, Hsun-Yun; You, Yun-Wen; Liao, Hua-Yang [Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China); Kuo, Yu-Ting; Kao, Wei-Lun; Yen, Guo-Ji; Tsai, Meng-Hung [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Shyue, Jing-Jong, E-mail: shyue@gate.sinica.edu.tw [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China)

    2012-03-09

    Highlights: Black-Right-Pointing-Pointer Multiple peptides are detected and quantified at the same time without labeling. Black-Right-Pointing-Pointer C{sub 60}{sup +} ion is responsible for generating molecular-specific ions at high mass. Black-Right-Pointing-Pointer The co-sputtering yielded more steady depth profile and more well defined interface. Black-Right-Pointing-Pointer The fluence of auxiliary Ar{sup +} does not affect the quantification curve. Black-Right-Pointing-Pointer The damage from Ar{sup +} is masked by high sputtering yield of C{sub 60}{sup +}. - Abstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C{sub 60}{sup +} primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C{sub 60}{sup +} primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01-2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar{sup +} was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C{sub 60}{sup +} bombardment, which suppressed the ion intensities during the depth

  4. Nanoscale wedge polishing of superconducting thin films-an easy way to obtain depth dependent information by surface analysis techniques

    International Nuclear Information System (INIS)

    Shapoval, T; Engel, S; Gruendlich, M; Meier, D; Backen, E; Neu, V; Holzapfel, B; Schultz, L

    2008-01-01

    A mechanical wedge polishing procedure that offers a simple, cost-effective and rapid way to look into the depth of a thin film with different surface-sensitive scanning techniques has been developed. As an example of its wide applicability, this method was utilized for the investigation of two differently prepared superconducting YBa 2 Cu 3 O 7-δ thin films: an Hf-doped film prepared by chemical solution deposition and an undoped film grown by pulsed laser deposition. Upon polishing, the roughness of the samples was reduced to less than 5 nm (peak-to-valley) without influencing the superconducting properties of the films. Thus, nanoscale polishing opens up a unique possibility for microscopic studies with various surface-sensitive techniques. We demonstrate the successful imaging of flux lines by low temperature magnetic force microscopy after polishing a formerly rough as-prepared film. By applying the wedge polishing procedure to the Hf-doped sample, high resolution electron backscattering diffraction investigations reveal the homogeneous distribution of non-superconducting BaHfO 3 nanoparticles in the whole volume of the film

  5. Crack-depth effects in the cylindrically guided wave technique for bolt and pump-shaft inspections

    International Nuclear Information System (INIS)

    Tsai, Y.M.; Liu, S.N.; Light, G.M.

    1991-01-01

    Nuclear power plants have experienced the failures of bolts and pump shafts. The industry is concerned about nondestructive evaluation (NDE) techniques that can be applied to these components. The cylindrically guided wave technique (CGWT) has been developed to detect the simulated circumferential defects in long bolts and studs. The ultrasonic CGWT employs the zero-degree longitudinal waves constrained to travel within the boundary of the components with cylindrical shape during inspection. When longitudinal waves are guided to travel along a cylinder, and impinge onto a circumferential defect, the waves are scattered at the crack on the cylinder surface. In this work, the wave scattering at the circumferential crack on a long cylinder is investigated. The transfer factor of the scattered waves is calculated for a wide range of frequency spectra. The scattered waveform at a distance away from a crack is calculated. The effect that crack depth exerts to the waveform in CGWT is shown. CGWT signals, waveform calculation and so on are reported. (K.I.)

  6. Do Targeted Hiring Subsidies and Profiling Techniques Reduce Unemployment?

    DEFF Research Database (Denmark)

    Jahn, Elke; Wagner, Thomas

    To reduce equilibrium unemployment targeted hiring subsidies and profilin techniques for long-term unemployed are often recommended. To analyze the effects of these two instruments, our model combines two search methods: the public employment serviceand random search, jobseekers choose between...... an active and a passive search strategy, while labour market policy has two options available. First, only the long-term unemployed placed by the public employment service are subsidized. Second, the subsidy is paid for each match with a long-term unemployed irrespective of the search method used. We show...

  7. Study on of Seepage Flow Velocity in Sand Layer Profile as Affected by Water Depth and Slope Gradience

    Science.gov (United States)

    Han, Z.; Chen, X.

    2017-12-01

    BACKGROUND: The subsurface water flow velocity is of great significance in understanding the hydrodynamic characteristics of soil seepage and the influence of interaction between seepage flow and surface runoff on the soil erosion and sediment transport process. OBJECTIVE: To propose a visualized method and equipment for determining the seepage flow velocity and measuring the actual flow velocity and Darcy velocity as well as the relationship between them.METHOD: A transparent organic glass tank is used as the test soil tank, the white river sand is used as the seepage test material and the fluorescent dye is used as the indicator for tracing water flow, so as to determine the thickness and velocity of water flow in a visualized way. Water is supplied at the same flow rate (0.84 L h-1) to the three parts with an interval of 1m at the bottom of the soil tank and the pore water velocity and the thickness of each water layer are determined under four gradient conditions. The Darcy velocity of each layer is calculated according to the water supply flow and the discharge section area. The effective discharge flow pore is estimated according to the moisture content and porosity and then the relationship between Darcy velocity and the measured velocity is calculated based on the water supply flow and the water layer thickness, and finally the correctness of the calculation results is verified. RESULTS: According to the velocity calculation results, Darcy velocity increases significantly with the increase of gradient; in the sand layer profile, the flow velocity of pore water at different depths increases with the increase of gradient; under the condition of the same gradient, the lower sand layer has the maximum flow velocity of pore water. The air-filled porosity of sand layer determines the proportional relationship between Darcy velocity and pore flow velocity. CONCLUSIONS: The actual flow velocity and Darcy velocity can be measured by a visualized method and the

  8. High repetition Thomson scattering profile measurements using a nonimaging technique

    International Nuclear Information System (INIS)

    Zigler, A.

    1983-01-01

    The Thomson scattering technique is one of the most useful diagnostics for the study of magnetically confined plasmas. In this work, a simple multi-space and time Thomson scattering technique has been proposed. The spatial resolution is obtained by conversion of the scattered laser light collected from different plasma points into a time sequence. This can be done by focusing the image of the laser beam through a wideangle lens onto an array of fiber optic light pipes. Since the laser emits relatively short pulses (1020 nsec), scattered light pulses from each of the light pipes can be delayed relative to one another without overlapping. Such delays can be achieved by using an array of fiber optics of differing lengths (2-4 meters). The light is transmitted then into a spectrometer and detected by fast detectros (few nsec rise and fall time). Reconstruction from the time sequence to the spatial structure is obtained by using existing fast gate circuits. The data then is A/D converted and handled by using a data acquisition system

  9. Non-destructive depth profiling of solid samples by atomic and nuclear interactions induced by charged particles

    International Nuclear Information System (INIS)

    Demortier, Guy

    2003-01-01

    The study of complex materials (non-homogeneous matrices containing medium and/or heavy atoms as major elements) by Particle Induced X-Ray Emission (PIXE) requires the tailoring of the experimental set up to take into account the high X-ray intensity produced by these main elements present at the surface, as well as the expected low intensity from other elements 'buried' in the substrate. The determination of traces is therefore limited and the minimum detection limit is generally higher by at least two orders of magnitude in comparison with those achievable for low Z matrices (Z≤20). Additionally, those high Z matrices, having a high absorption capability, are not always homogeneous. The non-homogeneity may be, on the one hand, a layered structure (which is uneasy to profile by Rutherford Backscattering Spectroscopy (RBS) if the material contains elements of neighbouring atomic masses or if the layered structure extends on several microns). PIXE measurements at various incident energies (and with various projectiles (p, d, He 3 , He 4 )) are an alternative method to overcome those difficulties. The use of special filters to selectively decrease the intensity of the most intense X-ray lines, the accurate calculation of the characteristic X-ray intensity ratios (Kα/Kβ, Lα/Lβ) of individual elements, the computation of the secondary X-ray fluorescence induced in thick targets are amongst the most important parameters to be investigated in order to solve these analytical problems. Examples of Al, Si, Cu, Ag, Au based alloys as encountered in industrial and archaeological metallurgy are discussed. The non-destructive aspect of the ion beam techniques is proved by applying the method in vivo for the study of fluorine migration in tooth enamel. Preliminary results on the composition of the blocks of the pyramid of Cheops are presented in the scope of a complete revision of the procedure of its construction

  10. Effects of recoil-implanted oxygen on depth profiles of defects and annealing processes in P{sup +}-implanted Si studied using monoenergetic positron beams

    Energy Technology Data Exchange (ETDEWEB)

    Uedono, Akira; Moriya, Tsuyoshi; Tanigawa, Shoichiro [Tsukuba Univ., Ibaraki (Japan). Inst. of Materials Science; Kitano, Tomohisa; Watanabe, Masahito; Kawano, Takao; Suzuki, Ryoichi; Ohdaira, Toshiyuki; Mikado, Tomohisa

    1996-04-01

    Effects of oxygen atoms recoiled from SiO{sub 2} films on depth profiles of defects and annealing processes in P{sup +}-implanted Si were studied using monoenergetic positron beams. For an epitaxial Si specimen, the depth profile of defects was found to be shifted toward the surface by recoil implantation of oxygen atoms. This was attributed to the formation of vacancy-oxygen complexes and a resultant decrease in the diffusion length of vacancy-type defects. The recoiled oxygen atoms stabilized amorphous regions introduced by P{sup +}-implantation, and the annealing of these regions was observed after rapid thermal annealing (RTA) at 700degC. For a Czochralski-grown Si specimen fabricated by through-oxide implantation, the recoiled oxygen atoms introduced interstitial-type defects upon RTA below the SiO{sub 2}/Si interface, and such defects were dissociated by annealing at 1000degC. (author)

  11. Ion beam sputtering and depth profiling: on the characteristics of the induced roughness and the means to cure it at best

    International Nuclear Information System (INIS)

    Limoge, Y.; Maurice, F.; Zemskoff, A.

    1987-01-01

    The purpose of the present communication is to report the first results of a study devoted to the understanding of the surface roughness due either to statistical fluctuations in sputtering or sample microstructural inhomogeneities. In a second part, we shall propose a new method to correct the experimental profiles from the blurring effect of the sample roughness in typical cases of in-depth analysis

  12. Roughness development in the depth profiling with 500 eV O2+ beam with the combination of oxygen flooding and sample rotation

    International Nuclear Information System (INIS)

    Gui, D.; Xing, Z.X.; Huang, Y.H.; Mo, Z.Q.; Hua, Y.N.; Zhao, S.P.; Cha, L.Z.

    2008-01-01

    Roughness development is one of the most often addressed issues in the secondary ion mass spectrometry (SIMS) ultra-shallow depth profiling. The effect of oxygen flooding pressure on the roughness development has been investigated under the bombardment of 500 eV O 2 + beam with simultaneous sample rotation. Oxygen flooding had two competing effects on the surface roughening, i.e., enhancement of initiating roughening and suppression of roughening development, which were suggested to be described by the onset depth z on and transient width w tr of surface roughening. Both z on and w tr decreased as oxygen flooding pressure increased. As the result, surface roughening was most pronounced at the intermediate pressure from 4.4E-5 Pa to 5.8E-5 Pa. The surface roughening is negligible while without flooding or with flooding at the saturated pressure. No flooding is preferable for depth profiling ultra-shallow B implantation because of the better B profile shape and short analysis time

  13. Depth profiling of Al{sub 2}O{sub 3} + TiO{sub 2} nanolaminates by means of a time-of-flight energy spectrometer

    Energy Technology Data Exchange (ETDEWEB)

    Laitinen, M., E-mail: mikko.i.laitinen@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Sajavaara, T., E-mail: timo.sajavaara@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Rossi, M., E-mail: mikko.rossi@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Julin, J., E-mail: jaakko.julin@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Puurunen, R.L., E-mail: riikka.puurunen@vtt.fi [VTT Technical Research Centre of Finland, Tietotie 3, FI-02150 Espoo (Finland); Suni, T., E-mail: tommi.suni@vtt.fi [VTT Technical Research Centre of Finland, Tietotie 3, FI-02150 Espoo (Finland); Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Ishida, T., E-mail: tadashii@iis.u-tokyo.ac.jp [Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Fujita, H., E-mail: fujita@iis.u-tokyo.ac.jp [Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Arstila, K., E-mail: kai.arstila@imec.be [Imec, Kapeldreef 75, Leuven 3001 (Belgium); Brijs, B., E-mail: bert.brijs@imec.be [Imec, Kapeldreef 75, Leuven 3001 (Belgium); Whitlow, H.J., E-mail: harry.j.whitlow@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland)

    2011-12-15

    Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and mechanical properties of thin films. In this study the elemental depth profiles and surface roughnesses were determined for Al{sub 2}O{sub 3} + TiO{sub 2} nanolaminates with nominal single-layer thicknesses of 1, 2, 5, 10 and 20 nm and total thickness between 40 nm and 60 nm. The depth profiles were measured by means of a time-of-flight elastic recoil detection analysis (ToF-ERDA) spectrometer recently installed at the University of Jyvaeskylae. In TOF-E measurements {sup 63}Cu, {sup 35}Cl, {sup 12}C and {sup 4}He ions with energies ranging from 0.5 to 10 MeV, were used and depth profiles of the whole nanolaminate film could be analyzed down to 5 nm individual layer thickness.

  14. A New Profile Learning Model for Recommendation System based on Machine Learning Technique

    Directory of Open Access Journals (Sweden)

    Shereen H. Ali

    2016-03-01

    Full Text Available Recommender systems (RSs have been used to successfully address the information overload problem by providing personalized and targeted recommendations to the end users. RSs are software tools and techniques providing suggestions for items to be of use to a user, hence, they typically apply techniques and methodologies from Data Mining. The main contribution of this paper is to introduce a new user profile learning model to promote the recommendation accuracy of vertical recommendation systems. The proposed profile learning model employs the vertical classifier that has been used in multi classification module of the Intelligent Adaptive Vertical Recommendation (IAVR system to discover the user’s area of interest, and then build the user’s profile accordingly. Experimental results have proven the effectiveness of the proposed profile learning model, which accordingly will promote the recommendation accuracy.

  15. New Professional Profiles and Skills in the Journalistic Field: A Scoping Review and In-Depth Interviews with Professionals in Spain

    Directory of Open Access Journals (Sweden)

    Paula Marques-Hayasaki

    2016-12-01

    Full Text Available The professional profiles and skills related to journalism are adapting to a new paradigm as a consequence of the advent of new technologies - the web 2.0, the end of the monopoly of news production by mass media, etc. This study aims to provide a comprehensive critical mapping of new professional profiles and skills demanded in the field of journalism, based on a scoping review and in-depth interviews with professionals and academics in Spain. The results show a great variety of new profiles and nomenclatures. This is in part because of a significant overlapping in the functions emphasized by them. With regards to skills, the traditional ones are still the most valued by the market, although new competencies are becoming more and more important.

  16. In-depth investigation on physicochemical and thermal properties of magnesium (II gluconate using spectroscopic and thermoanalytical techniques

    Directory of Open Access Journals (Sweden)

    Mahendra Kumar Trivedi

    2017-10-01

    Full Text Available Magnesium gluconate is a classical organometallic pharmaceutical compound used for the prevention and treatment of hypomagnesemia as a source of magnesium ion. The present research described the in-depth study on solid state properties viz. physicochemical and thermal properties of magnesium gluconate using sophisticated analytical techniques like PXRD, PSA, FT-IR, UV–Vis spectroscopy, TGA/DTG, and DSC. Magnesium gluconate was found to be crystalline in nature along with the crystallite size ranging from 14.10 to 47.35 nm. The particle size distribution was at d(0.1=6.552 µm, d(0.5=38.299 µm, d(0.9=173.712 µm and D(4,3=67.122 µm along with the specific surface area of 0.372 m2/g. The wavelength for the maximum absorbance was at 198.0 nm. Magnesium gluconate exhibited 88.51% weight loss with three stages of thermal degradation process up to 895.18 °C from room temperature. The TGA/DTG thermograms of the analyte indicated that magnesium gluconate was thermally stable up to around 165 °C. Consequently, the melting temperature of magnesium gluconate was found to be 169.90 °C along with the enthalpy of fusion of 308.7 J/g. Thus, the authors conclude that the achieved results from this study are very useful in pharmaceutical and nutraceutical industries for the identification, characterization and qualitative analysis of magnesium gluconate for preformulation studies and also for developing magnesium gluconate based novel formulation.

  17. #%In-depth investigation on physicochemical and thermal properties of magnesium (II) gluconate using spectroscopic and thermoanalytical techniques

    Institute of Scientific and Technical Information of China (English)

    #

    2017-01-01

    Magnesium gluconate is a classical organometallic pharmaceutical compound used for the prevention and treatment of hypomagnesemia as a source of magnesium ion. The present research described the in-depth study on solid state properties viz. physicochemical and thermal properties of magnesium gluconate using sophisticated analytical techniques like Powder X-ray diffraction (PXRD), particle size analysis ( PSA), Fourier transform infrared (FT-IR) spectrometry, ultraviolet–visible (UV–Vis) spectroscopy, thermogravimetric analysis (TGA)/differential thermogravimetric analysis (DTG), and differential scanning calorimetry (DSC). Magnesium gluconate was found to be crystalline in nature along with the crystallite size ranging from 14.10 to 47.35 nm. The particle size distribution was at d(0.1)=6.552 μm, d(0.5)=38.299 μm, d(0.9)=173.712 μm and D(4,3)=67.122 μm along with the specific surface area of 0.372 m2/g. The wavelength for the maximum absorbance was at 198.0 nm. Magnesium gluconate exhibited 88.51% weight loss with three stages of thermal degradation process up to 895.18 ℃ from room temperature. The TGA/DTG thermograms of the analyte indicated that magnesium gluconate was thermally stable up to around 165 ℃. Consequently, the melting temperature of magnesium gluconate was found to be 169.90 ℃ along with the enthalpy of fusion of 308.7 J/g. Thus, the authors conclude that the achieved results from this study are very useful in pharmaceutical and nutraceutical industries for the identification, characterization and qualitative analysis of magnesium gluconate for preformulation studies and also for developing magnesium gluconate based novel formulation.

  18. Investigation of Arctic and Antarctic spatial and depth patterns of sea water in CTD profiles using chemometric data analysis

    DEFF Research Database (Denmark)

    Kotwa, Ewelina Katarzyna; Lacorte, Silvia; Duarte, Carlos

    2014-01-01

    In this paper we examine 2- and 3-way chemometric methods for analysis of Arctic and Antarctic water samples. Standard CTD (conductivity–temperature–depth) sensor devices were used during two oceanographic expeditions (July 2007 in the Arctic; February 2009 in the Antarctic) covering a total of 174...

  19. Diurnal variations in depth profiles of UV-induced DNA damage and inhibition of bacterioplankton production in tropical coastal waters

    NARCIS (Netherlands)

    Visser, PM; Poos, JJ; Scheper, BB; Boelen, P; van Duyl, FC

    2002-01-01

    In this study, diurnal changes in bacterial production and DNA damage in bacterio-plankton (measured as cyclobutane pyrimidine dimers, CPDs) incubated in bags at different depths in tropical coastal waters were investigated. The DNA damage and inhibition of the bacterial production was highest at

  20. Development of measurement technique for crack depth in weld zone of thick stainless steel pipe with ultrasonic phased array TOFD

    International Nuclear Information System (INIS)

    Ishida, Hitoshi

    2006-01-01

    Phased array TOFD (time of flight diffraction) method which makes possible to detect tip diffraction echoes and measure crack depth in an austenitic stainless steel weld zone with a thickness of more than 25 mm to which region it was difficult to apply ultrasonic test due to scattering of ultrasonic waves has been developed. The developed method uses a single array transducer to have a short distance between incident points of transmitter and receiver in order to propagate waves in shorter pass in the weld region. Transmitting and receiving ultrasonic beams from a single array probe can be set a crossing point and a focal point at desired depth. This method makes possible to scan with 16 kinds of combination of crossing points and focal pints of ultrasonic beam at a time. We have examined fundamental characteristics of depth measurement with electric discharge machining slits on base metal of a stainless steel with a thickness of 35 mm. As the results: (1) We could measure the slit depth with 0.2mm error from the slit depth with a estimating method of a lateral wave propagation time with back wall echo. (2) The largest error of the depth measurement from the slit depth with the ultrasonic beam crossing point set at the 4mm different point from the tip of the slit was 0.3 mm. (3) The largest error of the depth measurements due to the difference of focal point depth of ultrasonic beam was 0.2 mm. (4) The highest tip diffraction echo could be observed with the ultrasonic beam cross point set at the tip of the slit. The difference of 4 mm between the cross point and the tip of the slit caused attenuation of tip diffraction echo height in -6.8 dB. Furthermore we have measured a depth of electric discharge machining slits, fatigue cracks and stress corrosion cracking (SCC) on stainless steel welded pipe specimens with a thickness of 35 mm. As the results: (1) We could detect the tip diffraction echoes which have a signal noise ratio with more than 2.4 from the fatigue

  1. In vivo confocal Raman microscopic determination of depth profiles of the stratum corneum lipid organization influenced by application of various oils.

    Science.gov (United States)

    Choe, ChunSik; Schleusener, Johannes; Lademann, Jürgen; Darvin, Maxim E

    2017-08-01

    The intercellular lipids (ICL) of stratum corneum (SC) play an important role in maintaining the skin barrier function. The lateral and lamellar packing order of ICL in SC is not homogenous, but rather depth-dependent. This study aimed to analyze the influence of the topically applied mineral-derived (paraffin and petrolatum) and plant-derived (almond oil and jojoba oil) oils on the depth-dependent ICL profile ordering of the SC in vivo. Confocal Raman microscopy (CRM), a unique tool to analyze the depth profile of the ICL structure non-invasively, is employed to investigate the interaction between oils and human SC in vivo. The results show that the response of SC to oils' permeation varies in the depths. All oils remain in the upper layers of the SC (0-20% of SC thickness) and show predominated differences of ICL ordering from intact skin. In these depths, skin treated with plant-derived oils shows more disordered lateral and lamellar packing order of ICL than intact skin (p0.1), except plant-derived oils at the depth 30% of SC thickness. In the deeper layers of the SC (60-100% of SC thickness), no difference between ICL lateral packing order of the oil-treated and intact skin can be observed, except that at the depths of 70-90% of the SC thickness, where slight changes with more disorder states are measured for plant-derived oil treated skin (p<0.1), which could be explained by the penetration of free fatty acid fractions in the deep-located SC areas. Both oil types remain in the superficial layers of the SC (0-20% of the SC thickness). Skin treated with mineral- and plant-derived oils shows significantly higher disordered lateral and lamellar packing order of ICL in these layers of the SC compared to intact skin. Plant-derived oils significantly changed the ICL ordering in the depths of 30% and 70-90% of the SC thickness, which is likely due to the penetration of free fatty acids in the deeper layers of the SC. Copyright © 2017 Japanese Society for

  2. Profiling of barrier capacitance and spreading resistance using a transient linearly increasing voltage technique.

    Science.gov (United States)

    Gaubas, E; Ceponis, T; Kusakovskij, J

    2011-08-01

    A technique for the combined measurement of barrier capacitance and spreading resistance profiles using a linearly increasing voltage pulse is presented. The technique is based on the measurement and analysis of current transients, due to the barrier and diffusion capacitance, and the spreading resistance, between a needle probe and sample. To control the impact of deep traps in the barrier capacitance, a steady state bias illumination with infrared light was employed. Measurements of the spreading resistance and barrier capacitance profiles using a stepwise positioned probe on cross sectioned silicon pin diodes and pnp structures are presented.

  3. Chemical weathering of a marine terrace chronosequence, Santa Cruz, California I: Interpreting rates and controls based on soil concentration-depth profiles

    Science.gov (United States)

    White, A.F.; Schulz, M.S.; Vivit, D.V.; Blum, A.E.; Stonestrom, David A.; Anderson, S.P.

    2008-01-01

    The spatial and temporal changes in element and mineral concentrations in regolith profiles in a chronosequence developed on marine terraces along coastal California are interpreted in terms of chemical weathering rates and processes. In regoliths up to 15 m deep and 226 kyrs old, quartz-normalized mass transfer coefficients indicate non-stoichiometric preferential release of Sr > Ca > Na from plagioclase along with lesser amounts of K, Rb and Ba derived from K-feldspar. Smectite weathering results in the loss of Mg and concurrent incorporation of Al and Fe into secondary kaolinite and Fe-oxides in shallow argillic horizons. Elemental losses from weathering of the Santa Cruz terraces fall within the range of those for other marine terraces along the Pacific Coast of North America. Residual amounts of plagioclase and K-feldspar decrease with terrace depth and increasing age. The gradient of the weathering profile bs is defined by the ratio of the weathering rate, R to the velocity at which the profile penetrates into the protolith. A spreadsheet calculator further refines profile geometries, demonstrating that the non-linear regions at low residual feldspar concentrations at shallow depth are dominated by exponential changes in mineral surface-to-volume ratios and at high residual feldspar concentrations, at greater depth, by the approach to thermodynamic saturation. These parameters are of secondary importance to the fluid flux qh, which in thermodynamically saturated pore water, controls the weathering velocity and mineral losses from the profiles. Long-term fluid fluxes required to reproduce the feldspar weathering profiles are in agreement with contemporary values based on solute Cl balances (qh = 0.025-0.17 m yr-1). During saturation-controlled and solute-limited weathering, the greater loss of plagioclase relative to K-feldspar is dependent on the large difference in their respective solubilities instead of the small difference between their respective

  4. Digging a Little Deeper: Microbial Communities, Molecular Composition and Soil Organic Matter Turnover along Tropical Forest Soil Depth Profiles

    Science.gov (United States)

    Pett-Ridge, J.; McFarlane, K. J.; Heckman, K. A.; Reed, S.; Green, E. A.; Nico, P. S.; Tfaily, M. M.; Wood, T. E.; Plante, A. F.

    2016-12-01

    Tropical forest soils store more carbon (C) than any other terrestrial ecosystem and exchange vast amounts of CO2, water, and energy with the atmosphere. Much of this C is leached and stored in deep soil layers where we know little about its fate or the microbial communities that drive deep soil biogeochemistry. Organic matter (OM) in tropical soils appears to be associated with mineral particles, suggesting deep soils may provide greater C stabilization. However, few studies have evaluated sub-surface soils in tropical ecosystems, including estimates of the turnover times of deep soil C, the sensitivity of this C to global environmental change, and the microorganisms involved. We quantified bulk C pools, microbial communities, molecular composition of soil organic matter, and soil radiocarbon turnover times from surface soils to 1.5m depths in multiple soil pits across the Luquillo Experimental Forest, Puerto Rico. Soil C, nitrogen, and root and microbial biomass all declined exponentially with depth; total C concentrations dropped from 5.5% at the surface to communities in surface soils (Acidobacteria and Proteobacteria) versus those below the active rooting zone (Verrucomicrobia and Thaumarchaea). High resolution mass spectrometry (FTICR-MS) analyses suggest a shift in the composition of OM with depth (especially in the water soluble fraction), an increase in oxidation, and decreasing H/C with depth (indicating higher aromaticity). Additionally, surface samples were rich in lignin-like compounds of plant origin that were absent with depth. Soil OM 14C and mean turnover times were variable across replicate horizons, ranging from 3-1500 years at the surface, to 5000-40,000 years at depth. In comparison to temperate deciduous forests, these 14C values reflect far older soil C. Particulate organic matter (free light fraction), with a relatively modern 14C was found in low but measureable concentration in even the deepest soil horizons. Our results indicate these

  5. Pattern and intensity of human impact on coral reefs depend on depth along the reef profile and on the descriptor adopted

    Science.gov (United States)

    Nepote, Ettore; Bianchi, Carlo Nike; Chiantore, Mariachiara; Morri, Carla; Montefalcone, Monica

    2016-09-01

    Coral reefs are threatened by multiple global and local disturbances. The Maldives, already heavily hit by the 1998 mass bleaching event, are currently affected also by growing tourism and coastal development that may add to global impacts. Most of the studies investigating effects of local disturbances on coral reefs assessed the response of communities along a horizontal distance from the impact source. This study investigated the status of a Maldivian coral reef around an island where an international touristic airport has been recently (2009-2011) built, at different depths along the reef profile (5-20 m depth) and considering the change in the percentage of cover of five different non-taxonomic descriptors assessed through underwater visual surveys: hard corals, soft corals, other invertebrates, macroalgae and abiotic attributes. Eight reefs in areas not affected by any coastal development were used as controls and showed a reduction of hard coral cover and an increase of abiotic attributes (i.e. sand, rock, coral rubble) at the impacted reef. However, hard coral cover, the most widely used descriptor of coral reef health, was not sufficient on its own to detect subtle indirect effects that occurred down the reef profile. Selecting an array of descriptors and considering different depths, where corals may find a refuge from climate impacts, could guide the efforts of minimising local human pressures on coral reefs.

  6. Analyzing the trophic link between the mesopelagic microbial loop and zooplankton from observed depth profiles of bacteria and protozoa

    Directory of Open Access Journals (Sweden)

    T. Tanaka

    2005-01-01

    Full Text Available It is widely recognized that organic carbon exported to the ocean aphotic layer is significantly consumed by heterotrophic organisms such as bacteria and zooplankton in the mesopelagic layer. However, very little is known for the trophic link between bacteria and zooplankton or the function of the microbial loop in this layer. In the northwestern Mediterranean, recent studies have shown that viruses, bacteria, heterotrophic nanoflagellates, and ciliates distribute down to 2000 m with group-specific depth-dependent decreases, and that bacterial production decreases with depth down to 1000 m. Here we show that such data can be analyzed using a simple steady-state food chain model to quantify the carbon flow from bacteria to zooplankton over the mesopelagic layer. The model indicates that bacterial mortality by viruses is similar to or 1.5 times greater than that by heterotrophic nanoflagellates, and that heterotrophic nanoflagellates transfer little of bacterial production to higher trophic levels.

  7. Capillary electrokinetic separation techniques for profiling of drugs and related products

    NARCIS (Netherlands)

    Hilhorst, M.J; Somsen, G.W; de Jong, G.J.

    Capillary electrokinetic separation techniques offer high efficiency and peak capacity, and can be very useful for the analysis of samples containing a large variety of (unknown) compounds. Such samples are frequently met in impurity profiling of drugs (detection of potential impurities in a

  8. Overview of the neural network based technique for monitoring of road condition via reconstructed road profiles

    CSIR Research Space (South Africa)

    Ngwangwa, HM

    2008-07-01

    Full Text Available on the road and driver to assess the integrity of road and vehicle infrastructure. In this paper, vehicle vibration data are applied to an artificial neural network to reconstruct the corresponding road surface profiles. The results show that the technique...

  9. Assessment of surface runoff depth changes in S\\varǎţel River basin, Romania using GIS techniques

    Science.gov (United States)

    Romulus, Costache; Iulia, Fontanine; Ema, Corodescu

    2014-09-01

    S\\varǎţel River basin, which is located in Curvature Subcarpahian area, has been facing an obvious increase in frequency of hydrological risk phenomena, associated with torrential events, during the last years. This trend is highly related to the increase in frequency of the extreme climatic phenomena and to the land use changes. The present study is aimed to highlight the spatial and quantitative changes occurred in surface runoff depth in S\\varǎţel catchment, between 1990-2006. This purpose was reached by estimating the surface runoff depth assignable to the average annual rainfall, by means of SCS-CN method, which was integrated into the GIS environment through the ArcCN-Runoff extension, for ArcGIS 10.1. In order to compute the surface runoff depth, by CN method, the land cover and the hydrological soil classes were introduced as vector (polygon data), while the curve number and the average annual rainfall were introduced as tables. After spatially modeling the surface runoff depth for the two years, the 1990 raster dataset was subtracted from the 2006 raster dataset, in order to highlight the changes in surface runoff depth.

  10. Determination of the particulate extinction-coefficient profile and the column-integrated lidar ratios using the backscatter-coefficient and optical-depth profiles

    Science.gov (United States)

    Vladimir A Kovalev; Wei Min Hao; Cyle Wold

    2007-01-01

    A new method is considered that can be used for inverting data obtained from a combined elastic-inelastic lidar or a high spectral resolution lidar operating in a one-directional mode, or an elastic lidar operating in a multiangle mode. The particulate extinction coefficient is retrieved from the simultaneously measured profiles of the particulate backscatter...

  11. Techniques for obtaining velocity distributions of atoms or ions from Doppler-broadened spectral line profiles

    International Nuclear Information System (INIS)

    Moran, T.G.

    1986-12-01

    Analysis of the doppler-broadened profiles of spectral lines radiated by atoms or ions in plasmas yields information about their velocity distributions. Researchers have analysed profiles of lines radiated by atoms in isotropic velocity distributions in several ways, one being the inversion of the integral equation which relates the velocity distribution to the line profile. This inversion formula was derived for a separate application and was given to within an arbitrary multiplicative constant. This paper presents a new derivation which obtains the inversion exactly, using a method which is easily generalized for determination of anisotropic velocity distribution functions. The technique to obtain an anisotropic velocity distribution function from line profiles measured at different angles is outlined

  12. Investigating Surface and Interface Phenomena in LiFeBO3 Electrodes Using Photoelectron Spectroscopy Depth Profiling

    DEFF Research Database (Denmark)

    Maibach, Julia; Younesi, Reza; Schwarzburger, Nele

    2014-01-01

    The formation of surface and interface layers at the electrodes is highly important for the performance and stability of lithium ion batteries. To unravel the surface composition of electrode materials, photoelectron spectroscopy (PES) is highly suitable as it probes chemical surface and interface...... properties with high surface sensitivity. Additionally, by using synchrotron-generated hard x-rays as excitation source, larger probing depths compared to in-house PES can be achieved. Therefore, the combination of in-house soft x-ray photoelectron spectroscopy and hard x-ray photoelectron spectroscopy...

  13. Depth profile of strain and composition in Si/Ge dot multilayers by microscopic phonon Raman spectroscopy

    International Nuclear Information System (INIS)

    Tan, P.H.; Bougeard, D.; Abstreiter, G.; Brunner, K.

    2005-01-01

    We characterized strain and Ge content depending on depth in a self-assembled Si/Ge dot multilayer by scanning a microscopic Raman probe at a (110) cleavage plane. The multilayer structure was deposited by molecular-beam epitaxy on a (001) Si substrate and consisted of 80 periods, each of them composed by 25 nm Si spacers and 8 monolayer Ge forming laterally and vertically uncorrelated islands with a height of 2 nm and a lateral diameter of about 20 nm. An average biaxial strain of -3.5% within the core regions of islands is determined from the splitting of longitudinal and transversal optical Ge-Ge phonon modes observed in polarized Raman measurements. The absolute mode frequencies further enable analysis of a Ge content of 0.82. The analyzed strain and composition of islands are nearly independent from depths below the sample surface. This indicates well-controlled deposition parameters and negligible intermixing during deposition of subsequent layers. These Raman results are in agreement with x-ray diffraction data. Small, local Raman frequency shifts were observed and discussed with respect to partial elastic strain relaxation of the multilayer stack after cleavage, undefined Raman-scattering geometries at the sample edge, and local heating by the laser probe

  14. Depth profiling of thin film solar cell components by synchrotron excited Soft X-ray emission spectroscopy (SXES)

    Energy Technology Data Exchange (ETDEWEB)

    Moenig, Harry; Grimm, Alexander; Lux-Steiner, Martha; Saez-Araoz, Rodrigo; Fischer, Christian-Herbert [Freie Universitaet Berlin (Germany); Baer, Markus [University of Las Vegas (United States); Camus, Christian; Ennaoui, Ahmed; Kaufmann, Christian; Koerber, Paul; Kropp, Timo; Lauermann, Iver; Lehmann, Sebastian; Muenchenberg, Tim; Pistor, Paul; Puttnins, Stefan; Schock, Hans-Werner; Sokoll, Stefan [Hahn-Meitner-Institut Berlin (Germany); Jung, Christian [BESSY GmbH Berlin (Germany)

    2007-07-01

    Depending on the elemental composition of a material, SXES provides an information depth of 50-1000 nm. For studies of thin multilayer structures tuning of this parameter is highly desirable. One possibility is the variation of the excitation energy, which is accompanied by variation of photoionisation cross sections. Alternatively, we performed angle resolved SXES on the solar cell absorber material Cu(In,Ga)Se{sub 2} covered by CdS or Zn(S,O) buffer layers (10-50 nm). Due to our setup geometry, the emission spectra clearly display increased surface sensitivity at small (grazing exit) and large (grazing incidence) exit angles. A model based on Beer-Lamberts law and setup geometry is in reasonable agreement with our experimental data.The presented results show that angle resolved SXES measurements yield depth-dependent information on multilayer structures. The increased surface sensitivity at grazing exit and grazing incidence angles allows the detection of extremely thin cover layers at reasonable recording times.

  15. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings

    Energy Technology Data Exchange (ETDEWEB)

    Finot, M.; Kesler, O.; Suresh, S.

    1998-12-08

    A technique for determining properties such as Young`s modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined. 11 figs.

  16. Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings

    Energy Technology Data Exchange (ETDEWEB)

    Finot, Marc (Somerville, MA); Kesler, Olivera (Cambridge, MA); Suresh, Subra (Wellesley, MA)

    1998-01-01

    A technique for determining properties such as Young's modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined.

  17. Investigation of percentage depth dose and dose rate dependence of PAGAT polymer gel dosimeter for photon beams using MRI technique

    International Nuclear Information System (INIS)

    Azadbakht, B.; Hadad, K.; Zahmatkesh, M. H.

    2010-01-01

    In this work, the investigation of the normoxic Pagan polymer-gel dosimeter percentage depth dose and it's dose rate dependence has been made. Using MRI, the formulation to give the maximum change in the transverse relaxation rate R2 was determined to be 4.5% N,N'-methylene-bis-acrylamide(bis), 4.5% acrylamide, 5% gelatine, 5 m M tetrakis (hydroxymethyl) phosphonium chloride, 0.01 m M hydroquinone and 86% HPLC(Water). Irradiation of vials was performed using photon beams of Co-60 therapy unit and an Elec ta linear accelerator. Gel dosimeters were imaged in a Siemens Symphony 1.5 Tesla clinical MRI scanner using a head coil. Post-manufacture irradiation and post imaging times were both selected to be 1 day. For determining the percentage depth dose of the Pagan gel it was found that at the depth of 21 cm, the percentage depth dose for 1.25 MeV γ-ray photons of 60 Co and for 4,6 and 18 MV x-ray photons of Elec ta linear accelerator, are 48%, 52%, 57.3% and 59.73%, respectively. Thus, in the case of the higher energy photon beams, a higher dose can he delivered. to deep-seated tumors. The dose rate dependence of percentage depth dose was studied for 6 MV x-ray photons with the use of dose rates of 80, 160, 240, 320, 400 and 480 c Gy/min. No trend in polymer-gel dosimeter 1/T 2 dependence was found on the mean dose rate and energy for the photon beams.

  18. Absorbed doses profiles vs Synovia tissue depth for the Y-90 and P-32 used in radiosynoviortesis treatment

    International Nuclear Information System (INIS)

    Torres B, M.B.; Ayra P, F.E.; Garcia R, E.; Cornejo D, N.; Yoriyaz, H.

    2006-01-01

    The radiosynoviortesis treatment has been used during more of 40 years as an alternative to the chemical and surgical synovectomy to alleviate the pain and to reduce the inflammation in suffered patients of rheumatic arthropathies, haemophilic arthropathies and other articulation disorders. It consists on the injection of radioactive isotopes inside a synovial cavity. For to evaluate the dosimetry of the radiosynoviortesis treatment is of great interest to know the absorbed dose in the volume of the target (synovia). The precise calculation of the absorbed dose in the inflamed synovia it is difficult, for numerous reasons, since the same one will depend on the thickness of the synovial membrane, the size of the articular space, the structure of the synovial membrane, the distribution in the articulation, the nature of the articular liquid, etc. Also the presence of the bone and the articular cartilage, components also of the articulation, it even complicated more the calculations. The method used to evaluate the dosimetry in radioactive synovectomy is known as the Monte Carlo method. The objective of our work consists on estimating with the Monte Carlo code MCNP4B the absorbed dose of the Y-90 and the P-32 in the depth of the synovial tissue. The results are presented as absorbed dose for injected millicurie (Gy/mCi) versus depth of synovial tissue. The simulation one carries out keeping in mind several synovia areas, of 50 cm 2 to 250 cm 2 keeping in mind three states of progression of the illness. Those obtained values of absorbed dose using the MCNP4B code will allow to introduce in our country an optimized method of dose prescription to the patient, to treat the rheumatic arthritis in medium and big articulations using the Y-90 and the P-32, eliminating the fixed doses and fixed radionuclides for each articulation like it happens in many clinics of Europe, as well as the empiric doses. (Author)

  19. A one-dimensional Fickian model to predict the Ga depth profiles in three-stage Cu(In,Ga)Se{sub 2}

    Energy Technology Data Exchange (ETDEWEB)

    Rodriguez-Alvarez, H., E-mail: humberto.rodriguez@helmholtz-berlin.de [International Iberian Nanotechnology Laboratory, Avenida Mestre Jose Veiga s/n, 4715-330 Braga (Portugal); Helmholtz-Zentrum Berlin, Hahn-Meitner Platz 1, 14109 Berlin (Germany); Mainz, R. [Helmholtz-Zentrum Berlin, Hahn-Meitner Platz 1, 14109 Berlin (Germany); Sadewasser, S. [International Iberian Nanotechnology Laboratory, Avenida Mestre Jose Veiga s/n, 4715-330 Braga (Portugal)

    2014-05-28

    We present a one-dimensional Fickian model that predicts the formation of a double Ga gradient during the fabrication of Cu(In,Ga)Se{sub 2} thin films by three-stage thermal co-evaporation. The model is based on chemical reaction equations, structural data, and effective Ga diffusivities. In the model, the Cu(In,Ga)Se{sub 2} surface is depleted from Ga during the deposition of Cu-Se in the second deposition stage, leading to an accumulation of Ga near the back contact. During the third deposition stage, where In-Ga-Se is deposited at the surface, the atomic fluxes within the growing layer are inverted. This results in the formation of a double Ga gradient within the Cu(In,Ga)Se{sub 2} layer and reproduces experimentally observed Ga distributions. The final shape of the Ga depth profile strongly depends on the temperatures, times and deposition rates used. The model is used to evaluate possible paths to flatten the marked Ga depth profile that is obtained when depositing at low substrate temperatures. We conclude that inserting Ga during the second deposition stage is an effective way to achieve this.

  20. A one-dimensional Fickian model to predict the Ga depth profiles in three-stage Cu(In,Ga)Se2

    International Nuclear Information System (INIS)

    Rodriguez-Alvarez, H.; Mainz, R.; Sadewasser, S.

    2014-01-01

    We present a one-dimensional Fickian model that predicts the formation of a double Ga gradient during the fabrication of Cu(In,Ga)Se 2 thin films by three-stage thermal co-evaporation. The model is based on chemical reaction equations, structural data, and effective Ga diffusivities. In the model, the Cu(In,Ga)Se 2 surface is depleted from Ga during the deposition of Cu-Se in the second deposition stage, leading to an accumulation of Ga near the back contact. During the third deposition stage, where In-Ga-Se is deposited at the surface, the atomic fluxes within the growing layer are inverted. This results in the formation of a double Ga gradient within the Cu(In,Ga)Se 2 layer and reproduces experimentally observed Ga distributions. The final shape of the Ga depth profile strongly depends on the temperatures, times and deposition rates used. The model is used to evaluate possible paths to flatten the marked Ga depth profile that is obtained when depositing at low substrate temperatures. We conclude that inserting Ga during the second deposition stage is an effective way to achieve this.

  1. Depth profiling of transport properties of in-situ grown YBa_2Cu_3O_7-x films for coated conductor applications

    Science.gov (United States)

    Jo, William; Huh, J.-U.; Hammond, R. H.; Beasley, M. R.

    2003-03-01

    We report depth profiling of the local critical current density and resistivity of YBa_2Cu_3O_7-x (YBCO) films grown by in-situ electron beam evaporation. The method provides important information on the uniformity of the films, and therefore on the commonly observed property that the critical currents of coated conductor high temperature superconductor films do not scale linearly with thickness. Using a methodology of layer-by-layer etching, depth profiling of critical currents and resistivity of the films has been achieved. We use a Bromine methanol mixture to etch down YBCO films with an etch rate of 60 nm/min. At each step, we also observe surface morphology using high resolution scanning electron microscopy. In this talk, we report further study of the results found earlier that YBCO films deposited at high rates are composed of an upper layer of defected YBCO with a local Jc of 5 - 7 MA/cm^2 and a lower more perfect layer with no critical current capacity. The information derived may be useful in the characterization and optimization of superconducting thin films for electrical power and other applications.

  2. Quantitative AMS depth profiling of the hydrogen isotopes collected in graphite divertor and wall tiles of the tokamak ASDEX-Upgrade

    International Nuclear Information System (INIS)

    Sun, G.Y.; Friedrich, M.; Groetzschel, R.; Buerger, W.; Behrisch, R.; Garcia-Rosales, C.

    1997-01-01

    The accelerator mass spectrometry (AMS) facility at the 3 MV Tandetron in Rossendorf has been applied for quantitative depth profiling of deuterium and tritium in samples cut from graphite protection tiles at the vessel walls of the fusion experiment ASDEX-Upgrade at the Max-Planck-Institut fuer Plasmaphysik in Garching. The tritium originates from D(d,p)T fusion reactions in the plasma and it is implanted in the vessel walls together with deuterium atoms and ions from the plasma. The T concentrations in the surface layers down to the analyzing depth of about 25 μm are in the range of 10 11 to 5 x 10 15 T-atoms/cm 3 corresponding to a tritium retention of 3 x 10 10 to 3.5 x 10 12 T-atoms/cm 2 . The much higher deuterium concentrations in the samples were simultaneously measured by calibrated conventional SIMS. In the surface layers down to the analyzing depth of about 25 μm the deuterium concentrations are between 3 x 10 18 and 8 x 10 21 atoms/cm 3 , corresponding to a deuterium retention of 2.5 x 10 16 to 2.5 x 10 18 atoms/cm 2 The estimated total amount of tritium in the vessel walls is of the same order of magnitude as the total number of neutrons produced in D(d,n) 3 He reactions. (orig.)

  3. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Northwestern Hawaiian Islands from 2015-07-31 to 2015-08-19 (NCEI Accession 0161170)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  4. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago from 2016-09-01 to 2016-09-27 (NCEI Accession 0161171)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  5. Temperature profile and water depth data collected from ANGO and other platforms using XBT casts in the TOGA Area - Atlantic from 14 February 1992 to 13 April 1993 (NODC Accession 9400047)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using XBT casts from the ANGO and other platforms in the TOGA - Atlantic Ocean. Data were collected from 14...

  6. Temperature profile and water depth collected from XIANG YANG HONG 05 in the South China Sea using BT and XBT casts from 16 November 1986 to 03 December 1986 (NODC Accession 8700009)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth were collected using BT and XBT casts from the XIANG YANG HONG 05 in the South China Sea. Data were collected from 16 November...

  7. Temperature profile and water depth data collected from SAXON STAR and other platforms in a World wide distribution from 09 March 1983 to 12 November 1986 (NODC Accession 8700035)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the SAXON STAR and other platforms in a World wide distribution. Data were collected...

  8. Temperature profile and water depth data collected from BROOKE using BT and XBT casts in the North Pacific Ocean from 03 October 1975 to 18 November 1977 (NODC Accession 8900225)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the BROOKE in the North Pacific Ocean and TOGA Area - Pacific Ocean. Data were...

  9. Temperature profile and water depth data collected from DALE and other platforms using BT and XBT casts in the North / South Pacific Ocean from 09 November 1979 to 25 November 1985 (NODC Accession 8900063)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the DALE and other platforms in the North / South Pacific Ocean. Data were...

  10. Temperature profile and water depth collected from ZAMBEZE and other platforms using BT and XBT casts in the Atlantic Ocean from 21 July 1981 to 02 December 1985 (NODC Accession 8600293)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the ZAMBEZE and other platforms in the Northeast / Southwest Atlantic Ocean. Data...

  11. Temperature profile and water depth data collected from AMERICAN VIKING using BT and XBT casts in the Northeast Pacific Ocean from 23 September 1986 to 17 September 1987 (NODC Accession 8800048)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the AMERICAN VIKING in the Northeast Pacific Ocean. Data were collected from 23...

  12. Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean from 01 December 1987 to 05 January 1988 (NODC Accession 8800015)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIOT LANE in the Northwest Atlantic Ocean. Data were collected from...

  13. Temperature profile and water depth data collected from USCGC HARRIET LANE using BT and XBT casts in the Northwest Atlantic Ocean from 21 July 1988 to 18 August 1988 (NODC Accession 8800256)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIET LANE in the Northwest Atlantic Ocean. Data were collected from...

  14. Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean and Caribbean Sea from 30 April 1988 to 31 May 1988 (NODC Accession 8800173)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIOT LANE in the Northwest Atlantic Ocean and Caribbean Sea. Data...

  15. Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the NW Atlantic Ocean for 1987-05-31 (NODC Accession 8700225)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC Harriot Lane in the Northwest Atlantic Ocean and TOGA Area - Atlantic...

  16. Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean from 09 March 1988 to 10 March 1988 (NODC Accession 8800094)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC Harriot Lane in the Northwest Atlantic Ocean. Data were collected from...

  17. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Mariana Archipelago from 2014-03-24 to 2014-05-05 (NCEI Accession 0161168)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  18. Temperature profile and water depth data collected from SEDCO / BP 471 using BT and XBT casts in the East Indian Archipelago and TOGA Area - Pacific Ocean from 14 November 1988 to 20 December 1988 (NODC Accession 8900043)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the SEDCO / BP 471 in the East Indian Archipelago. and TOGA Area - Pacific Ocean....

  19. Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the Indian ocean and other seas from 07 January 1989 to 31 January 1989 (NODC Accession 8900034)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the Indian Ocean, South China Sea, Burma Sea, and Malacca of...

  20. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Pacific Remote Island Areas from 2015-01-26 to 2015-04-28 (NCEI Accession 0162247)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  1. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across Wake Island from 2014-03-16 to 2014-03-19 (NCEI Accession 0162248)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  2. Temperature profile and water depth data collected from AUSTRALIA STAR and other platforms using XBT casts in the TOGA Area - Atlantic and Pacific Ocean from 05 October 1989 to 21 December 1992 (NODC Accession 9400035)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using XBT casts from the AUSTRALIA STAR and other platforms in the TOGA Area - Atlantic and Pacific Ocean,...

  3. Temperature profile and water depth data collected from USS Merrill using BT and XBT casts in the Indian Ocean and other seas from 1988-03-01 to 1988-03-29 (NODC Accession 8800110)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in the Arabian Sea, Gulf of Oman, and Indian Ocean. Data were...

  4. Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the TOGA Area - Pacific Ocean and other areas from 03 November 1988 to 01 December 1988 (NODC Accession 8800327)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the TOGA Area - Pacific Ocean, Bay of Bengal, Indian Ocean,...

  5. Temperature profile and water depth data collected from USS MERRILL using BT and XBT casts in the Indian Ocean and other seas from 05 April 1988 to 11 April 1988 (NODC Accession 8800140)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in the Indian Ocean, Arabian Sea, and Gulf of Oman. Data were...

  6. Temperature profile and water depth data collected from USS MERRILL using BT and XBT casts in the Indian Ocean and other seas from 17 May 1988 to 01 June 1988 (NODC Accession 8800181)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in Arabian Sea, Indian Ocean, Gulf of Oman, Laccadive Sea, and...

  7. Temperature profile and water depth data collected from USS HENRY B. WILSON using BT and XBT casts in the Indian Ocean and other seas from 22 October 1986 to 26 November 1986 (NODC Accession 8800183)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS HENRY B. WILSON in the Indian Ocean, Gulf of Oman, Gulf of Iran, and...

  8. Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the Indian Ocean and other seas from 02 December 1988 to 28 December 1988 (NODC Accession 8900015)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the Indian Ocean, Arabian Sea, Gulf of Oman, Gulf of Iran, and...

  9. Temperature profile and water depth data collected from USS ROBERT G. BRADLEY using BT and XBT casts in the NE/NW Atlantic Ocean and other seas from 03 May 1988 to 31 May 1988 (NODC Accession 8800213)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS ROBERT G. BRADLEY in the Northwest / Northeast Atlantic Ocean, Arabian...

  10. Temperature profile and water depth data collected from USS THACH using BT and XBT casts in the Persian Sea from 04 December 1987 to 08 December 1987 (NODC Accession 8800030)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS THACH in the Persian Sea. Data were collected from 04 December 1987 to 08...

  11. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across Jarvis Island from 2016-05-19 to 2016-05-23 (NCEI Accession 0162245)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  12. Temperature profile and water depth data collected from RATHBURNE in the NW Pacific (limit-180 W) and other areas from 02 February 1986 to 28 February 1986 (NODC Accession 8600093)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the RATHBURNE in the Northwest Pacific Ocean and other areas. Data were collected from...

  13. Temperature profile and water depth data from BT and XBT casts in the Atlantic Ocean from USCGC POLAR SEA from 14 December 1983 to 06 May 1984 (NODC Accession 8600108)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC POLAR SEA in the Atlantic Ocean. Data were collected from 14 December...

  14. Temperature profile and water depth data collected from USS JOHN RODGERS using BT and XBT casts in the NE/NW Atlantic Ocean and other seas from 03 August 1988 to 03 October 1988 (NODC Accession 8900041)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS JOHN RODGERS in the Northeast / Northwest Atlantic Ocean, Ionian Sea,...

  15. Temperature profile and water depth collected from BT and XBT casts in the Northwest Atlantic Ocean from SEDCO BP 471 from 03 November 1985 to 23 December 1985 (NODC Accession 8600138)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the SEDCO BP 471 in the Northwest Atlantic Ocean. Data were collected from 03...

  16. National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across American Samoa from 2015-02-15 to 2015-03-28 (NCEI Accession 0161169)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

  17. In-depth 2-DE reference map of Aspergillus fumigatus and its proteomic profiling on exposure to itraconazole.

    Science.gov (United States)

    Gautam, Poonam; Mushahary, Dolly; Hassan, Wazid; Upadhyay, Santosh Kumar; Madan, Taruna; Sirdeshmukh, Ravi; Sundaram, Curam Sreenivasacharlu; Sarma, Puranam Usha

    2016-07-01

    Aspergillus fumigatus (A. fumigatus) is a medically important opportunistic fungus that may lead to invasive aspergillosis in humans with weak immune system. Proteomic profiling of this fungus on exposure to itraconazole (ITC), an azole antifungal drug, may lead to identification of its molecular targets and better understanding on the development of drug resistance against ITC in A. fumigatus. Here, proteome analysis was performed using 2-DE followed by mass spectrometric analysis which resulted in identification of a total of 259 unique proteins. Further, proteome profiling of A. fumigatus was carried out on exposure to ITC, 0.154 μg/ml, the minimum inhibitory concentration (MIC50). Image analysis showed altered levels of 175 proteins (66 upregulated and 109 downregulated) of A. fumigatus treated with ITC as compared to the untreated control. Peptide mass fingerprinting led to the identification of 54 proteins (12 up-regulated and 42 down-regulated). The differentially expressed proteins include proteins related to cell stress, carbohydrate metabolism and amino acid metabolism. We also observed four proteins, including nucleotide phosphate kinase (NDK), that are reported to interact with calcineurin, a protein involved in regulation of cell morphology and fungal virulence. Comparison of differentially expressed proteins on exposure to ITC with artemisinin (ART), an antimalarial drug with antifungal activity(1), revealed a total of 26 proteins to be common among them suggesting that common proteins and pathways are targeted by these two antifungal agents. The proteins targeted by ITC may serve as important leads for development of new antifungal drugs. © The Author 2016. Published by Oxford University Press on behalf of The International Society for Human and Animal Mycology. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  18. Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

    International Nuclear Information System (INIS)

    Reinsberg, K.-G.; Schumacher, C.; Tempez, A.; Nielsch, K.; Broekaert, J.A.C.

    2012-01-01

    In this work the depth-profile analysis of thermoelectric layers deposited on Au and Cr covered Si wafers with the aid of pulsed radiofrequency glow discharge time-of-flight mass spectrometry (pulsed RF-GD-TOFMS also called plasma profiling TOFMS (PP-TOFMS™)) is described. For thermoelectric materials the depth resolutions obtained with both PP-TOFMS and secondary ion mass spectrometry (SIMS) are shown to be well comparable and in the order of the roughness of the corresponding layers (between 20 and 3700 nm). With both methods a direct solid analysis without any preparation steps is possible. In addition, the analysis of the samples with PP-TOFMS proved to be faster by a factor of 26 compared to SIMS, as sputtering rates were found to be 80 nm s −1 and 3 nm s −1 , respectively. For the analyzed samples the results of PP-TOFMS and SIMS show that a homogeneous deposition was obtained. Quantitative results for all samples could also be obtained directly by PP-TOFMS when the stoichiometry of one sample was determined beforehand for instance by inductively coupled plasma optical emission spectrometry (ICP-OES) and scanning electron microscopy energy dispersive X-ray fluorescence spectrometry (SEM-EDX). For Bi 2 Te 3 the standard deviation for the main component concentrations within one sample then is found to be between 1.1% and 1.9% and it is 3.6% from sample to sample. For Sb 2 Te 3 the values within one sample are from 1.7% to 4.2% and from sample to sample 5.3%, respectively. - Highlights: ► Depth resolution in sub micrometer size by glow discharge mass spectrometry. ► Bi and Sb telluride layers composition with GD-TOF-MS, ICP-OES and SEM-EDX agree. ► Homogeneities of layers measured with GD-TOF-MS and SIMS agree.

  19. Dislocation loops and their depth profiles in He[sup +] and D[sup +] ion irradiated nickel

    Energy Technology Data Exchange (ETDEWEB)

    Niwase, K [Dept. of Physics, Hyogo Univ. of Teacher Education, Yashiro (Japan); Ezawa, T [Dept. of Material Physics, Faculty of Engineering Science, Osaka Univ., Toyonaka (Japan); Tanabe, T [Dept. of Nuclear Engineering, Faculty of Engineering, Osaka Univ., Suita (Japan); Kiritani, M [Dept. of Nuclear Engineering, School of Engineering, Nagoya Univ. (Japan); Fujita, F E [Dept. of Material Physics, Faculty of Engineering Science, Osaka Univ., Toyonaka (Japan)

    1993-07-01

    Effects of implanted deuterium and helium on the formation of dislocation loops in Ni have been systematically investigated in terms of the irradiation temperature and dose by means of transmission electron microscopy. Significant enhancement of loop formation is observed only for He[sup +] irradiation. The number density of loops at 200 C for He[sup +] irradiation is about one order of magnitude higher than that of D[sup +] irradiation and the difference increases at higher temperatures. Significant decrease in the density occurs at about 300 C for D[sup +] irradiation, but it appears at about 600 C for He[sup +] irradiation. Below 200 C, continuous nucleation of loops is observed only for He[sup +] irradiation. The change in the loop depth distribution suggests that the nucleation of loops for He[sup +] irradiation is enhanced by some defects with a low mobility such as small He-vacancy complexes. The significant decrease in the loop density above 600 C is explained by the decrease in the concentration of the small He-vacancy complexes due to their absorption by large cavities or their escape to the specimen surface. (orig.)

  20. The derivation of vector magnetic fields from Stokes profiles - Integral versus least squares fitting techniques

    Science.gov (United States)

    Ronan, R. S.; Mickey, D. L.; Orrall, F. Q.

    1987-01-01

    The results of two methods for deriving photospheric vector magnetic fields from the Zeeman effect, as observed in the Fe I line at 6302.5 A at high spectral resolution (45 mA), are compared. The first method does not take magnetooptical effects into account, but determines the vector magnetic field from the integral properties of the Stokes profiles. The second method is an iterative least-squares fitting technique which fits the observed Stokes profiles to the profiles predicted by the Unno-Rachkovsky solution to the radiative transfer equation. For sunspot fields above about 1500 gauss, the two methods are found to agree in derived azimuthal and inclination angles to within about + or - 20 deg.

  1. Lumbar epidural depth using transverse ultrasound scan and its correlation with loss of resistance technique: A prospective observational study in Indian population.

    Science.gov (United States)

    Chauhan, Amit Kumar; Bhatia, Rohan; Agrawal, Sanjay

    2018-01-01

    The objective of the present study was to evaluate the skin-epidural space distance as assessed by ultrasonography and conventional loss of resistance (LOR) technique and to find the correlation of epidural depth with body mass index (BMI). Ninety-eight patients of either sex, American Society of Anesthesiology I/II, BMI transverse plane at L3-L4 intervertebral space. Thereafter, the epidural depth from skin was assessed with conventional LOR method while performing the epidural. The needle depth (ND) was measured using a sterile linear scale, and any change in the needle direction or intervertebral space was noted. The patients were demographically similar. Depth of epidural space measured by US depth (UD) was 3.96 ± 0.44 cm (range 3.18-5.44 cm) and by ND was 4.04 ± 0.52 cm (range 2.7-5.7 cm). The Pearson's correlation coefficient (r) between UD and ND was 0.935 (95% confidence interval: 0.72-0.92, r 2 = 0.874, P study demonstrates a good correlation between UD and ND and shows that the preprocedural US scan in transverse plane provides accurate needle entry site with a high success rate in single attempt for lumbar epidurals in patients with a BMI <30 kg/m 2 .

  2. High-throughput screening of Si-Ni flux for SiC solution growth using a high-temperature laser microscope observation and secondary ion mass spectroscopy depth profiling.

    Science.gov (United States)

    Maruyama, Shingo; Onuma, Aomi; Kurashige, Kazuhisa; Kato, Tomohisa; Okumura, Hajime; Matsumoto, Yuji

    2013-06-10

    Screening of Si-based flux materials for solution growth of SiC single crystals was demonstrated using a thin film composition-spread technique. The reactivity and diffusion of carbon in a composition spread of the flux was investigated by secondary ion mass spectroscopy depth profiling of the annealed flux thin film spread on a graphite substrate. The composition dependence of the chemical interaction between a seed crystal and flux materials was revealed by high-temperature thermal behavior observation of the flux and the subsequent morphological study of the surface after removing the flux using atomic force microscopy. Our new screening approach is shown to be an efficient process for understanding flux materials for SiC solution growth.

  3. Radiometric dating and quantitative analysis of elements in depth profiles of sediments by means of nuclear physical as well as X-ray fluorescence and atomic emission spectroscopic methods

    International Nuclear Information System (INIS)

    Schoenburg, M.

    1987-01-01

    The measurement of heavy metal concentration in sediments is of great importance for the assessment of water quality. If dating of the different layers of sediment cores is possible, informations about the history of pollution can be inferred. This paper describes the development and practical test of a procedure suitable for the investigation of sediment cores. Both the element analysis and the dating are based on physical methods. For element concentration determination inductively coupled plasma atomic emission spectrometry (ICP), total-reflection X-ray fluorescence analysis (TXRF) and neutron activation analysis (NAA) are used. The techniques are described and compared. For dating radiometric measurements of 210 Pb and 137 Cs are carried out with a coaxial well-type germanium γ-ray detector in a special low-level arrangement. Results of the systematic investigations are presented and a few individual depth profiles are discussed. (orig.) With 34 figs., 20 tabs [de

  4. In depth fusion flame spreading with a deuterium—tritium plane fuel density profile for plasma block ignition

    International Nuclear Information System (INIS)

    Malekynia, B.; Razavipour, S. S.

    2012-01-01

    Solid-state fuel ignition was given by Chu and Bobin according to the hydrodynamic theory at x = 0 qualitatively. A high threshold energy flux density, i.e., E* = 4.3 × 10 12 J/m 2 , has been reached. Recently, fast ignition by employing clean petawatt—picosecond laser pulses was performed. The anomalous phenomena were observed to be based on suppression of prepulses. The accelerated plasma block was used to ignite deuterium—tritium fuel at solid-state density. The detailed analysis of the thermonuclear wave propagation was investigated. Also the fusion conditions at x ≠ 0 layers were clarified by exactly solving hydrodynamic equations for plasma block ignition. In this paper, the applied physical mechanisms are determined for nonlinear force laser driven plasma blocks, thermonuclear reaction, heat transfer, electron—ion equilibration, stopping power of alpha particles, bremsstrahlung, expansion, density dependence, and fluid dynamics. New ignition conditions may be obtained by using temperature equations, including the density profile that is obtained by the continuity equation and expansion velocity. The density is only a function of x and independent of time. The ignition energy flux density, E* t , for the x ≠ 0 layers is 1.95 × 10 12 J/m 2 . Thus threshold ignition energy in comparison with that at x = 0 layers would be reduced to less than 50 percent. (physics of gases, plasmas, and electric discharges)

  5. Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies

    International Nuclear Information System (INIS)

    López-Escalante, M.C.; Gabás, M.; García, I.; Barrigón, E.; Rey-Stolle, I.; Algora, C.; Palanco, S.; Ramos-Barrado, J.R.

    2016-01-01

    Graphical abstract: - Highlights: • GaAs, AlInP and GaInP epi-layers grown in a MOVPE facility. • GaAs/GaInP and GaAs/AlInP interfaces studied through the combination of angle resolved and depth profile X-ray photoelectros spectroscopies. • GaAs/GaInP interface shows no features appart from GaAs, GaInP and mixed GaInAs or GaInAsP phases. • GaAs/AlInP interface shows traces of an anomalous P environment, probably due to P-P clusters. - Abstract: GaAs/GaInP and GaAs/AlInP interfaces have been studied using photoelectron spectroscopy tools. The combination of depth profile through Ar + sputtering and angle resolved X-ray photoelectron spectroscopy provides reliable information on the evolution of the interface chemistry. Measurement artifacts related to each particular technique can be ruled out on the basis of the results obtained with the other technique. GaAs/GaInP interface spreads out over a shorter length than GaAs/AlInP interface. The former could include the presence of the quaternary GaInAsP in addition to the nominal GaAs and GaInP layers. On the contrary, the GaAs/AlInP interface exhibits a higher degree of compound mixture. Namely, traces of P atoms in a chemical environment different to the usual AlInP coordination were found at the top of the GaAs/AlInP interface, as well as mixed phases like AlInP, GaInAsP or AlGaInAsP, located at the interface.

  6. Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies

    Energy Technology Data Exchange (ETDEWEB)

    López-Escalante, M.C., E-mail: mclopez@uma.es [Nanotech Unit, Laboratorio de Materiales y Superficies, Departamento de Ingeniería Química, Facultad de Ciencias, Universidad de Málaga, 29071 Málaga (Spain); Gabás, M. [The Nanotech Unit, Depto. de Física Aplicada I, Andalucía Tech, Universidad de Málaga, Campus de Teatinos s/n, 29071 Málaga Spain (Spain); García, I.; Barrigón, E.; Rey-Stolle, I.; Algora, C. [Instituto de Energía Solar, Universidad Politécnica de Madrid, Avda. Complutense 30, 28040 Madrid Spain (Spain); Palanco, S.; Ramos-Barrado, J.R. [The Nanotech Unit, Depto. de Física Aplicada I, Andalucía Tech, Universidad de Málaga, Campus de Teatinos s/n, 29071 Málaga Spain (Spain)

    2016-01-01

    Graphical abstract: - Highlights: • GaAs, AlInP and GaInP epi-layers grown in a MOVPE facility. • GaAs/GaInP and GaAs/AlInP interfaces studied through the combination of angle resolved and depth profile X-ray photoelectros spectroscopies. • GaAs/GaInP interface shows no features appart from GaAs, GaInP and mixed GaInAs or GaInAsP phases. • GaAs/AlInP interface shows traces of an anomalous P environment, probably due to P-P clusters. - Abstract: GaAs/GaInP and GaAs/AlInP interfaces have been studied using photoelectron spectroscopy tools. The combination of depth profile through Ar{sup +} sputtering and angle resolved X-ray photoelectron spectroscopy provides reliable information on the evolution of the interface chemistry. Measurement artifacts related to each particular technique can be ruled out on the basis of the results obtained with the other technique. GaAs/GaInP interface spreads out over a shorter length than GaAs/AlInP interface. The former could include the presence of the quaternary GaInAsP in addition to the nominal GaAs and GaInP layers. On the contrary, the GaAs/AlInP interface exhibits a higher degree of compound mixture. Namely, traces of P atoms in a chemical environment different to the usual AlInP coordination were found at the top of the GaAs/AlInP interface, as well as mixed phases like AlInP, GaInAsP or AlGaInAsP, located at the interface.

  7. The Ecological Profiles Technique applied to data from Lichtenburg, South Africa

    Directory of Open Access Journals (Sweden)

    J. W. Morris

    1974-12-01

    Full Text Available The method of ecological profiles and information shared between species and ecological variables, developed in France, is described for the first time in English. Preliminary results, using the technique on Bankenveld quadrat data from Lichtenburg, Western Transvaal, are given. It is concluded that the method has great potential value for the understanding of the autecology of South African species provided that the sampling method is appropriate.

  8. Molecular profiling techniques as tools to detect potential unintended effects in genetically engineered maize

    CSIR Research Space (South Africa)

    Barros, E

    2010-05-01

    Full Text Available Molecular Profiling Techniques as Tools to Detect Potential Unintended Effects in Genetically Engineered Maize Eugenia Barros Introduction In the early stages of production and commercialization of foods derived from genetically engineered (GE) plants... systems. In a recent paper published in Plant Biotechnology Journal,4 we compared two transgenic white maize lines with the non-transgenic counterpart to investigate two possible sources of variation: genetic engineering and environmental variation...

  9. A new, simple and precise method for measuring cyclotron proton beam energies using the activity vs. depth profile of zinc-65 in a thick target of stacked copper foils

    International Nuclear Information System (INIS)

    Asad, A.H.; Chan, S.; Cryer, D.; Burrage, J.W.; Siddiqui, S.A.; Price, R.I.

    2015-01-01

    The proton beam energy of an isochronous 18 MeV cyclotron was determined using a novel version of the stacked copper-foils technique. This simple method used stacked foils of natural copper forming ‘thick’ targets to produce Zn radioisotopes by the well-documented (p,x) monitor-reactions. Primary beam energy was calculated using the "6"5Zn activity vs. depth profile in the target, with the results obtained using "6"2Zn and "6"3Zn (as comparators) in close agreement. Results from separate measurements using foil thicknesses of 100, 75, 50 or 25 µm to form the stacks also concurred closely. Energy was determined by iterative least-squares comparison of the normalized measured activity profile in a target-stack with the equivalent calculated normalized profile, using ‘energy’ as the regression variable. The technique exploits the uniqueness of the shape of the activity vs. depth profile of the monitor isotope in the target stack for a specified incident energy. The energy using "6"5Zn activity profiles and 50-μm foils alone was 18.03±0.02 [SD] MeV (95%CI=17.98–18.08), and 18.06±0.12 MeV (95%CI=18.02–18.10; NS) when combining results from all isotopes and foil thicknesses. When the beam energy was re-measured using "6"5Zn and 50-μm foils only, following a major upgrade of the ion sources and nonmagnetic beam controls the results were 18.11±0.05 MeV (95%CI=18.00–18.23; NS compared with ‘before’). Since measurement of only one Zn monitor isotope is required to determine the normalized activity profile this indirect yet precise technique does not require a direct beam-current measurement or a gamma-spectroscopy efficiency calibrated with standard sources, though a characteristic photopeak must be identified. It has some advantages over published methods using the ratio of cross sections of monitor reactions, including the ability to determine energies across a broader range and without need for customized beam degraders. - Highlights: • Simple

  10. ChiMS: Open-source instrument control software platform on LabVIEW for imaging/depth profiling mass spectrometers.

    Science.gov (United States)

    Cui, Yang; Hanley, Luke

    2015-06-01

    ChiMS is an open-source data acquisition and control software program written within LabVIEW for high speed imaging and depth profiling mass spectrometers. ChiMS can also transfer large datasets from a digitizer to computer memory at high repetition rate, save data to hard disk at high throughput, and perform high speed data processing. The data acquisition mode generally simulates a digital oscilloscope, but with peripheral devices integrated for control as well as advanced data sorting and processing capabilities. Customized user-designed experiments can be easily written based on several included templates. ChiMS is additionally well suited to non-laser based mass spectrometers imaging and various other experiments in laser physics, physical chemistry, and surface science.

  11. Evaluation of an innovative radiographic technique - parallel profile radiography - to determine the dimensions of dentogingival unit

    Directory of Open Access Journals (Sweden)

    Sushama R Galgali

    2011-01-01

    Full Text Available Background: Maintenance of gingival health is a key factor for longevity of the teeth as well as of restorations. The physiologic dentogingival unit (DGU, which is composed of the epithelial and connective tissue attachments of the gingiva, functions as a barrier against microbial entry into the periodontium. Invasion of this space triggers inflammation and causes periodontal destruction. Despite the clinical relevance of the determination of the length and width of the DGU, there is no standardized technique. The length of the DGU can be either determined by histologic preparations or by transgingival probing. Although width can also be assessed by transgingival probing or with an ultrasound device, they are either invasive or expensive Aims: This study sought to evaluate an innovative radiographic exploration technique - parallel profile radiography - for measuring the dimensions of the DGU on the labial surfaces of anterior teeth. Materials and Methods: Two radiographs were made using the long-cone parallel technique in ten individuals, one in frontal projection, while the second radiograph was a parallel profile radiograph obtained from a lateral position. The length and width of the DGU was measured using computer software. Transgingival probing (trans-sulcular was done for these same patients and length of the DGU was measured. The values obtained by the two methods were compared. Pearson product correlation coefficient was calculated to examine the agreement between the values obtained by PPRx and transgingival probing. Results: The mean biologic width by the parallel profile radiography (PPRx technique was 1.72 mm (range 0.94-2.11 mm, while the mean thickness of the gingiva was 1.38 mm (range 0.92-1.77 mm. The mean biologic width by trans-gingival probing was 1.6 mm (range 0.8-2.2mm. Pearson product correlation coefficient (r for the above values was 0.914; thus, a high degree of agreement exists between the PPRx and TGP techniques

  12. Depth profiling of Pu, 241Am and 137Cs in soils from southern Belarus measured by ICP-MS and alpha and gamma spectrometry.

    Science.gov (United States)

    Boulyga, Sergei F; Zoriy, Myroslav; Ketterer, Michael E; Becker, J Sabine

    2003-08-01

    The depth distribution of plutonium, americium, and 137Cs originating from the 1986 accident at the Chernobyl Nuclear Power Plant (NPP) was investigated in several soil profiles in the vicinity from Belarus. The vertical migration of transuranic elements in soils typical of the 30 km relocation area around Chernobyl NPP was studied using inductively coupled plasma mass spectrometry (ICP-MS), alpha spectrometry, and gamma spectrometry. Transuranic concentrations in upper soil layers ranged from 6 x 10(-12) g g(-1) to 6 x 10(-10) g g(-1) for plutonium and from 1.8 x 10(-13) g g(-1) to 1.6 x 10(-11) g g(-1) for americium. These concentrations correspond to specific activities of (239+240)Pu of 24-2400 Bq kg(-1) and specific activity of 241Am of 23-2000 Bq kg(-1), respectively. Transuranics in turf-podzol soil migrate slowly to the deeper soil layers, thus, 80-95%, of radionuclide inventories were present in the 0-3 cm intervals of turf-podzol soils collected in 1994. In peat-marsh soil migration processes occur more rapidly than in turf-podzol and the maximum concentrations are found beneath the soil surface (down to 3-6 cm). The depth distributions of Pu and Am are essentially identical for a given soil profile. (239+240)Pu/137Cs and 241Am/137Cs activity ratios vary by up to a factor of 5 at some sites while smaller variations in these ratios were observed at a site close to Chernobyl, suggesting that 137Cs is dominantly particle associated close to Chernobyl but volatile species of 137Cs are of relatively greater importance at the distant sites.

  13. Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries

    Energy Technology Data Exchange (ETDEWEB)

    Oswald, S., E-mail: s.oswald@ifw-dresden.de; Hoffmann, M.; Zier, M.

    2017-04-15

    Highlights: • In XPS measurements at graphite anodes for Li-ion batteries specific binding energy variations are observed for the SEI species. • The binding energy variations depend on the charging state of the graphite and not on surface charging effects. • Obviously the presence of elemental Li leads to a potential surface gradient in contact with surface layers. • The energy position of implanted Ar can be used as characteristic feature during sputter depth profiling experiments. - Abstract: The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as most of the chemical species involved are non-conducting. Thus, the binding energy (BE) scale must be corrected to allow an accurate interpretation of the results. This is usually done using the peak position of the ubiquitous surface carbon contamination detectable for all Li-ion battery relevant materials. We herein report on the occurrence of peak shift phenomena that can be observed when investigating surface layers on graphite anodes using sputter depth-profiling. These shifts, however, are not related to classical static electric charging, but are depending on the state of charge (lithiation) of the anode material. The observations presented are in agreement with previous findings on other Li-containing materials and are obviously caused by the presence of Li in its elemental state. As aging and failure mechanisms in LIBs are closely linked to electrolyte reaction products on electrode surfaces it is of high importance to draw the correct conclusions on their chemical origin from XP spectra. In order to avoid misinterpretation of the BE positions, implanted Ar can be used for identification of relevant peak positions and species involved in the phenomena observed.

  14. Depth sensitivity of Lexan polycarbonate detector

    CERN Document Server

    Awad, E M

    1999-01-01

    The dependence of the registration sensitivity of Lexan polycarbonate with depth inside the detector was studied. Samples of Lexan from General Electric were irradiated to two long range ions. These were Ni and Au ions with a projectile energy of 0.3 and 1 GeV/n. Two independent techniques, the track-diameter technique (TDT) and the track profile technique (TPT), were used. The registration sensitivity was measured at depths of 7, 10, 15, 18, 20, 28, 35 and 40 mu m inside the detector. The results of the two techniques show that the detector sensitivity decreases gradually with the depth inside the detector. It reaches 20 % less compared to sensitivity at the surface after 40 mu m have been removed.

  15. Analysis of small field percent depth dose and profiles: Comparison of measurements with various detectors and effects of detector orientation with different jaw settings

    Directory of Open Access Journals (Sweden)

    Henry Finlay Godson

    2016-01-01

    Full Text Available The advent of modern technologies in radiotherapy poses an increased challenge in the determination of dosimetric parameters of small fields that exhibit a high degree of uncertainty. Percent depth dose and beam profiles were acquired using different detectors in two different orientations. The parameters such as relative surface dose (DS, depth of dose maximum (Dmax, percentage dose at 10 cm (D10, penumbral width, flatness, and symmetry were evaluated with different detectors. The dosimetric data were acquired for fields defined by jaws alone, multileaf collimator (MLC alone, and by MLC while the jaws were positioned at 0, 0.25, 0.5, and 1.0 cm away from MLC leaf-end using a Varian linear accelerator with 6 MV photon beam. The accuracy in the measurement of dosimetric parameters with various detectors for three different field definitions was evaluated. The relative DS(38.1% with photon field diode in parallel orientation was higher than electron field diode (EFD (27.9% values for 1 cm ×1 cm field. An overestimation of 5.7% and 8.6% in D10depth were observed for 1 cm ×1 cm field with RK ion chamber in parallel and perpendicular orientation, respectively, for the fields defined by MLC while jaw positioned at the edge of the field when compared to EFD values in parallel orientation. For this field definition, the in-plane penumbral widths obtained with ion chamber in parallel and perpendicular orientation were 3.9 mm, 5.6 mm for 1 cm ×1 cm field, respectively. Among all detectors used in the study, the unshielded diodes were found to be an appropriate choice of detector for the measurement of beam parameters in small fields.

  16. Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Reinsberg, K.-G. [Institute for Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, D-20146 Hamburg (Germany); Schumacher, C. [Institute for Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany); Tempez, A. [HORIBA Jobin Yvon, 16-18 rue du Canal, F-91160 Longjumeau (France); Nielsch, K. [Institute for Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany); Broekaert, J.A.C., E-mail: jose.broekaert@chemie.uni-hamburg.de [Institute for Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, D-20146 Hamburg (Germany)

    2012-10-15

    In this work the depth-profile analysis of thermoelectric layers deposited on Au and Cr covered Si wafers with the aid of pulsed radiofrequency glow discharge time-of-flight mass spectrometry (pulsed RF-GD-TOFMS also called plasma profiling TOFMS (PP-TOFMS Trade-Mark-Sign )) is described. For thermoelectric materials the depth resolutions obtained with both PP-TOFMS and secondary ion mass spectrometry (SIMS) are shown to be well comparable and in the order of the roughness of the corresponding layers (between 20 and 3700 nm). With both methods a direct solid analysis without any preparation steps is possible. In addition, the analysis of the samples with PP-TOFMS proved to be faster by a factor of 26 compared to SIMS, as sputtering rates were found to be 80 nm s{sup -1} and 3 nm s{sup -1}, respectively. For the analyzed samples the results of PP-TOFMS and SIMS show that a homogeneous deposition was obtained. Quantitative results for all samples could also be obtained directly by PP-TOFMS when the stoichiometry of one sample was determined beforehand for instance by inductively coupled plasma optical emission spectrometry (ICP-OES) and scanning electron microscopy energy dispersive X-ray fluorescence spectrometry (SEM-EDX). For Bi{sub 2}Te{sub 3} the standard deviation for the main component concentrations within one sample then is found to be between 1.1% and 1.9% and it is 3.6% from sample to sample. For Sb{sub 2}Te{sub 3} the values within one sample are from 1.7% to 4.2% and from sample to sample 5.3%, respectively. - Highlights: Black-Right-Pointing-Pointer Depth resolution in sub micrometer size by glow discharge mass spectrometry. Black-Right-Pointing-Pointer Bi and Sb telluride layers composition with GD-TOF-MS, ICP-OES and SEM-EDX agree. Black-Right-Pointing-Pointer Homogeneities of layers measured with GD-TOF-MS and SIMS agree.

  17. Cone penetrometer testing and discrete-depth groundwater sampling techniques: A cost-effective method of site characterization in a multiple-aquifer setting

    International Nuclear Information System (INIS)

    Zemo, D.A.; Pierce, Y.G.; Gallinatti, J.D.

    1992-01-01

    Cone penetrometer testing (CPT), combined with discrete-depth groundwater sampling methods, can reduce significantly the time and expense required to characterize large sites that have multiple aquifers. Results from the screening site characterization can be used to design and install a cost-effective monitoring well network. At a site in northern California, it was necessary to characterize the stratigraphy and the distribution of volatile organic compounds (VOCs) to a depth of 80 feet within a 1/2 mile-by-1/4-mile residential and commercial area in a complex alluvial fan setting. To expedite site characterization, a five-week field screening program was implemented that consisted of a shallow groundwater survey, CPT soundings, and discrete-depth groundwater sampling. Based on continuous lithologic information provided by the CPT soundings, four coarse-grained water-yielding sedimentary packages were identified. Eighty-three discrete-depth groundwater samples were collected using shallow groundwater survey techniques, the BAT Enviroprobe, or the QED HydroPunch 1, depending on subsurface conditions. A 20-well monitoring network was designed and installed to monitor critical points within each sedimentary package. Understanding the vertical VOC distribution and concentrations produced substantial cost savings by minimizing the number of permanent monitoring wells and reducing the number of costly conductor casings to be installed. Significant long-term cost savings will result from reduced sampling costs. Where total VOC concentrations exceeded 20 φg/l in the screening samples, a good correlation was found between the discrete-depth screening data and data from monitoring wells. Using a screening program to characterize the site before installing monitoring wells resulted in an estimated 50-percent reduction in costs for site characterization, 65-percent reduction in time for site characterization, and 50-percent reduction in long-term monitoring costs

  18. SU-C-213-04: Application of Depth Sensing and 3D-Printing Technique for Total Body Irradiation (TBI) Patient Measurement and Treatment Planning

    Energy Technology Data Exchange (ETDEWEB)

    Lee, M; Suh, T [Department of Biomedical Engineering, College of Medicine, The Catholic University of Korea, Seoul (Korea, Republic of); Research Institute of Biomedical Engineering, College of Medicine, The Catholic University of Korea, Seoul (Korea, Republic of); Han, B; Xing, L [Department of Radiation Oncology, Stanford University School of Medicine, Palo Alto, CA (United States); Jenkins, C [Department of Radiation Oncology, Stanford University School of Medicine, Palo Alto, CA (United States); Department of Mechanical Engineering, Stanford University, Palo Alto, CA (United States)

    2015-06-15

    Purpose: To develop and validate an innovative method of using depth sensing cameras and 3D printing techniques for Total Body Irradiation (TBI) treatment planning and compensator fabrication. Methods: A tablet with motion tracking cameras and integrated depth sensing was used to scan a RANDOTM phantom arranged in a TBI treatment booth to detect and store the 3D surface in a point cloud (PC) format. The accuracy of the detected surface was evaluated by comparison to extracted measurements from CT scan images. The thickness, source to surface distance and off-axis distance of the phantom at different body section was measured for TBI treatment planning. A 2D map containing a detailed compensator design was calculated to achieve uniform dose distribution throughout the phantom. The compensator was fabricated using a 3D printer, silicone molding and tungsten powder. In vivo dosimetry measurements were performed using optically stimulated luminescent detectors (OSLDs). Results: The whole scan of the anthropomorphic phantom took approximately 30 seconds. The mean error for thickness measurements at each section of phantom compare to CT was 0.44 ± 0.268 cm. These errors resulted in approximately 2% dose error calculation and 0.4 mm tungsten thickness deviation for the compensator design. The accuracy of 3D compensator printing was within 0.2 mm. In vivo measurements for an end-to-end test showed the overall dose difference was within 3%. Conclusion: Motion cameras and depth sensing techniques proved to be an accurate and efficient tool for TBI patient measurement and treatment planning. 3D printing technique improved the efficiency and accuracy of the compensator production and ensured a more accurate treatment delivery.

  19. SU-C-213-04: Application of Depth Sensing and 3D-Printing Technique for Total Body Irradiation (TBI) Patient Measurement and Treatment Planning

    International Nuclear Information System (INIS)

    Lee, M; Suh, T; Han, B; Xing, L; Jenkins, C

    2015-01-01

    Purpose: To develop and validate an innovative method of using depth sensing cameras and 3D printing techniques for Total Body Irradiation (TBI) treatment planning and compensator fabrication. Methods: A tablet with motion tracking cameras and integrated depth sensing was used to scan a RANDOTM phantom arranged in a TBI treatment booth to detect and store the 3D surface in a point cloud (PC) format. The accuracy of the detected surface was evaluated by comparison to extracted measurements from CT scan images. The thickness, source to surface distance and off-axis distance of the phantom at different body section was measured for TBI treatment planning. A 2D map containing a detailed compensator design was calculated to achieve uniform dose distribution throughout the phantom. The compensator was fabricated using a 3D printer, silicone molding and tungsten powder. In vivo dosimetry measurements were performed using optically stimulated luminescent detectors (OSLDs). Results: The whole scan of the anthropomorphic phantom took approximately 30 seconds. The mean error for thickness measurements at each section of phantom compare to CT was 0.44 ± 0.268 cm. These errors resulted in approximately 2% dose error calculation and 0.4 mm tungsten thickness deviation for the compensator design. The accuracy of 3D compensator printing was within 0.2 mm. In vivo measurements for an end-to-end test showed the overall dose difference was within 3%. Conclusion: Motion cameras and depth sensing techniques proved to be an accurate and efficient tool for TBI patient measurement and treatment planning. 3D printing technique improved the efficiency and accuracy of the compensator production and ensured a more accurate treatment delivery

  20. Biogenic Aerosols – Effects on Climate and Clouds. Cloud Optical Depth (COD) Sensor Three-Waveband Spectrally-Agile Technique (TWST) Field Campaign Report

    Energy Technology Data Exchange (ETDEWEB)

    Niple, E. R. [Aerodyne Research, Inc., Billerica, MA (United States); Scott, H. E. [Aerodyne Research, Inc., Billerica, MA (United States)

    2016-04-01

    This report describes the data collected by the Three-Waveband Spectrally-agile Technique (TWST) sensor deployed at Hyytiälä, Finland from 16 July to 31 August 2014 as a guest on the Biogenic Aerosols Effects on Climate and Clouds (BAECC) campaign. These data are currently available from the Atmospheric Radiation Measurement (ARM) Data Archive website and consists of Cloud Optical Depth (COD) measurements for the clouds directly overhead approximately every second (with some dropouts described below) during the daylight periods. A good range of cloud conditions were observed from clear sky to heavy rainfall.

  1. A cell-microelectronic sensing technique for profiling cytotoxicity of chemicals

    International Nuclear Information System (INIS)

    Boyd, Jessica M.; Huang, Li; Xie Li; Moe, Birget; Gabos, Stephan; Li Xingfang

    2008-01-01

    A cell-microelectronic sensing technique is developed for profiling chemical cytotoxicity and is used to study different cytotoxic effects of the same class chemicals using nitrosamines as examples. This technique uses three human cell lines (T24 bladder, HepG2 liver, and A549 lung carcinoma cells) and Chinese hamster ovary (CHO-K1) cells in parallel as the living components of the sensors of a real-time cell electronic sensing (RT-CES) method for dynamic monitoring of chemical toxicity. The RT-CES technique measures changes in the impedance of individual microelectronic wells that is correlated linearly with changes in cell numbers during t log phase of cell growth, thus allowing determination of cytotoxicity. Four nitrosamines, N-nitrosodimethylamine (NDMA), N-nitrosodiphenylamine (NDPhA), N-nitrosopiperidine (NPip), and N-nitrosopyrrolidine (NPyr), were examined and unique cytotoxicity profiles were detected for each nitrosamine. In vitro cytotoxicity values (IC 50 ) for NDPhA (ranging from 0.6 to 1.9 mM) were significantly lower than the IC 50 values for the well-known carcinogen NDMA (15-95 mM) in all four cell lines. T24 cells were the most sensitive to nitrosamine exposure among the four cell lines tested (T24 > CHO > A549 > HepG2), suggesting that T24 may serve as a new sensitive model for cytotoxicity screening. Cell staining results confirmed that administration of the IC 50 concentration from the RT-CES experiments inhibited cell growth by 50% compared to the controls, indicating that the RT-CES method provides reliable measures of IC 50 . Staining and cell-cycle analysis confirmed that NDPhA caused cell-cycle arrest at the G0/G1 phase, whereas NDMA did not disrupt the cell cycle but induced cell death, thus explaining the different cytotoxicity profiles detected by the RT-CES method. The parallel cytotoxicity profiling of nitrosamines on the four cell lines by the RT-CES method led to the discovery of the unique cytotoxicity of NDPhA causing cell

  2. A cell-microelectronic sensing technique for profiling cytotoxicity of chemicals

    Energy Technology Data Exchange (ETDEWEB)

    Boyd, Jessica M [Division of Analytical and Environmental Toxicology, Department of Laboratory Medicine and Pathology, Faculty of Medicine and Dentistry, 10-102 Clinical Sciences Building, Edmonton, Alberta, T6G 2G3 (Canada); Huang, Li [Environmental Health Sciences, Department of Public Health Sciences, School of Public Health, University of Alberta, 10-102 Clinical Sciences Building, Edmonton, Alberta, T6G 2G3 (Canada); Li, Xie; Moe, Birget [Division of Analytical and Environmental Toxicology, Department of Laboratory Medicine and Pathology, Faculty of Medicine and Dentistry, 10-102 Clinical Sciences Building, Edmonton, Alberta, T6G 2G3 (Canada); Gabos, Stephan [Public Health Surveillance and Environmental Health, Alberta Health and Wellness, 10025 Jasper Avenue, Box 1360, Edmonton, Alberta, T5J 2N3 (Canada); Xingfang, Li [Division of Analytical and Environmental Toxicology, Department of Laboratory Medicine and Pathology, Faculty of Medicine and Dentistry, 10-102 Clinical Sciences Building, Edmonton, Alberta, T6G 2G3 (Canada); Environmental Health Sciences, Department of Public Health Sciences, School of Public Health, University of Alberta, 10-102 Clinical Sciences Building, Edmonton, Alberta, T6G 2G3 (Canada)], E-mail: xingfang.li@ualberta.ca

    2008-05-12

    A cell-microelectronic sensing technique is developed for profiling chemical cytotoxicity and is used to study different cytotoxic effects of the same class chemicals using nitrosamines as examples. This technique uses three human cell lines (T24 bladder, HepG2 liver, and A549 lung carcinoma cells) and Chinese hamster ovary (CHO-K1) cells in parallel as the living components of the sensors of a real-time cell electronic sensing (RT-CES) method for dynamic monitoring of chemical toxicity. The RT-CES technique measures changes in the impedance of individual microelectronic wells that is correlated linearly with changes in cell numbers during t log phase of cell growth, thus allowing determination of cytotoxicity. Four nitrosamines, N-nitrosodimethylamine (NDMA), N-nitrosodiphenylamine (NDPhA), N-nitrosopiperidine (NPip), and N-nitrosopyrrolidine (NPyr), were examined and unique cytotoxicity profiles were detected for each nitrosamine. In vitro cytotoxicity values (IC{sub 50}) for NDPhA (ranging from 0.6 to 1.9 mM) were significantly lower than the IC{sub 50} values for the well-known carcinogen NDMA (15-95 mM) in all four cell lines. T24 cells were the most sensitive to nitrosamine exposure among the four cell lines tested (T24 > CHO > A549 > HepG2), suggesting that T24 may serve as a new sensitive model for cytotoxicity screening. Cell staining results confirmed that administration of the IC{sub 50} concentration from the RT-CES experiments inhibited cell growth by 50% compared to the controls, indicating that the RT-CES method provides reliable measures of IC{sub 50}. Staining and cell-cycle analysis confirmed that NDPhA caused cell-cycle arrest at the G0/G1 phase, whereas NDMA did not disrupt the cell cycle but induced cell death, thus explaining the different cytotoxicity profiles detected by the RT-CES method. The parallel cytotoxicity profiling of nitrosamines on the four cell lines by the RT-CES method led to the discovery of the unique cytotoxicity of NDPh

  3. Spectra from 2.5-15 μm of tissue phantom materials, optical clearing agents and ex vivo human skin: implications for depth profiling of human skin

    International Nuclear Information System (INIS)

    Viator, John A; Choi, Bernard; Peavy, George M; Kimel, Sol; Nelson, J Stuart

    2003-01-01

    Infrared measurements have been used to profile or image biological tissue, including human skin. Usually, analysis of such measurements has assumed that infrared absorption is due to water and collagen. Such an assumption may be reasonable for soft tissue, but introduction of exogenous agents into skin or the measurement of tissue phantoms has raised the question of their infrared absorption spectrum. We used Fourier transform infrared spectroscopy in attenuated total reflection mode to measure the infrared absorption spectra, in the range of 2-15 μm, of water, polyacrylamide, Intralipid, collagen gels, four hyperosmotic clearing agents (glycerol, 1,3-butylene glycol, trimethylolpropane, Topicare TM ), and ex vivo human stratum corneum and dermis. The absorption spectra of the phantom materials were similar to that of water, although additional structure was noted in the range of 6-10 μm. The absorption spectra of the clearing agents were more complex, with molecular absorption bands dominating between 6 and 12 μm. Dermis was similar to water, with collagen structure evident in the 6-10 μm range. Stratum corneum had a significantly lower absorption than dermis due to a lower content of water. These results suggest that the assumption of water-dominated absorption in the 2.5-6 μm range is valid. At longer wavelengths, clearing agent absorption spectra differ significantly from the water spectrum. This spectral information can be used in pulsed photothermal radiometry or utilized in the interpretation of reconstructions in which a constant μ ir is used. In such cases, overestimating μ ir will underestimate chromophore depth and vice versa, although the effect is dependent on actual chromophore depth. (note)

  4. Depth profiling Li in electrode materials of lithium ion battery by {sup 7}Li(p,γ){sup 8}Be and {sup 7}Li(p,α){sup 4}He nuclear reactions

    Energy Technology Data Exchange (ETDEWEB)

    Sunitha, Y., E-mail: sunibarc@gmail.com; Kumar, Sanjiv

    2017-06-01

    A proton induced γ-ray emission method based on {sup 7}Li(p,γ){sup 8}Be proton capture reaction and a nuclear reaction analysis method involving {sup 7}Li(p,α){sup 4}He reaction are described for depth profiling Li in the electrode materials, graphite and lithium cobalt oxide for example, of a Li-ion battery. Depth profiling by {sup 7}Li(p,γ){sup 8}Be reaction is accomplished by the resonance at 441 keV and involves the measurement of 14.6 and 17.6 MeV γ-rays, characteristic of the reaction, by a NaI(Tl) detector. The method has a detection sensitivity of ∼0.2 at% and enables profiling up to a depth ≥20 µm with a resolution of ≥150 nm. The profiling to a fairly large depth is facilitated by the absence of any other resonance up to 1800 keV proton energy. The reaction has substantial off-resonance cross-sections. A procedure is outlined for evaluating the off-resonance yields. Interferences from fluorine and aluminium are major limitation of this depth profiling methodology. The depth profile measurement by {sup 7}Li(p,α){sup 4}He reaction, on the other hand, utilises 2–3 MeV protons and entails the detection of α-particles at 90° or 150° angles. The reaction exhibits inverse kinematics at 150°. This method, too, suffers interference from fluorine due to the simultaneous occurrence of {sup 19}F(p,α){sup 16}O reaction. Kinematical considerations show that the interference is minimal at 90° and thus is the recommended angle of detection. The method is endowed with a detection sensitivity of ∼0.1 at%, a depth resolution of ∼100 nm and a probing depth of about 30 µm in the absence and 5–8 µm in the presence of fluorine in the material. Both methods yielded comparable depth profiles of Li in the cathode (lithium cobalt oxide) and the anode (graphite) of a Li-ion battery.

  5. Depth profile of production yields of {sup nat}Pb(p, xn) {sup 206,205,204,203,202,201}Bi nuclear reactions

    Energy Technology Data Exchange (ETDEWEB)

    Mokhtari Oranj, Leila [Division of Advanced Nuclear Engineering, POSTECH, Pohang 37673 (Korea, Republic of); Jung, Nam-Suk; Kim, Dong-Hyun; Lee, Arim; Bae, Oryun [Pohang Accelerator Laboratory, POSTECH, Pohang 37673 (Korea, Republic of); Lee, Hee-Seock, E-mail: lee@postech.ac.kr [Pohang Accelerator Laboratory, POSTECH, Pohang 37673 (Korea, Republic of)

    2016-11-01

    Experimental and simulation studies on the depth profiles of production yields of {sup nat}Pb(p, xn) {sup 206,205,204,203,202,201}Bi nuclear reactions were carried out. Irradiation experiments were performed at the high-intensity proton linac facility (KOMAC) in Korea. The targets, irradiated by 100-MeV protons, were arranged in a stack consisting of natural Pb, Al, Au foils and Pb plates. The proton beam intensity was determined by activation analysis method using {sup 27}Al(p, 3p1n){sup 24}Na, {sup 197}Au(p, p1n){sup 196}Au, and {sup 197}Au(p, p3n){sup 194}Au monitor reactions and also by Gafchromic film dosimetry method. The yields of produced radio-nuclei in the {sup nat}Pb activation foils and monitor foils were measured by HPGe spectroscopy system. Monte Carlo simulations were performed by FLUKA, PHITS/DCHAIN-SP, and MCNPX/FISPACT codes and the calculated data were compared with the experimental results. A satisfactory agreement was observed between the present experimental data and the simulations.

  6. Depth profiles of production yields of natPb(p, xn206,205,204,203,202 Bi reactions using 100-MeV proton beam

    Directory of Open Access Journals (Sweden)

    Oranj Leila Mokhtari

    2017-01-01

    Full Text Available In this study, results of the experimental study on the depth profiles of production yields of 206,205,204,203,202Bi radio-nuclei in the natural Pb target irradiated by a 100-MeV proton beam are presented. Irradiation was performed at proton linac facility (KOMAC in Korea. The target, irradiated by 100-MeV protons, was arranged in a stack consisting of natural Pb, Al, Au foils and Pb plates. The proton beam intensity was determined by activation analysis method using 27Al(p, 3p1n24Na, 197Au(p, p1n196Au, and 197Au(p, p3n194Au monitor reactions and also using dosimetry method by a Gafchromic film. The production yields of produced Bi radio-nuclei in the natural Pb foils and monitor reactions were measured by gamma-ray spectroscopy. Monte Carlo simulations were performed by FLUKA, PHITS, and MCNPX codes and compared with the measurements in order to verify validity of physical models and nuclear data libraries in the Monte Carlo codes. A fairly good agreement was observed between the present experimental data and the simulations by FLUKA, PHITS, and MCNPX. However, physical models and the nuclear data relevant to the end of range of protons in the codes need to be improved.

  7. Depth Profile of Impurity Phase in Wide-Bandgap Cu(In1-x ,Ga x )Se2 Film Fabricated by Three-Stage Process

    Science.gov (United States)

    Wang, Shenghao; Nazuka, Takehiro; Hagiya, Hideki; Takabayashi, Yutaro; Ishizuka, Shogo; Shibata, Hajime; Niki, Shigeru; Islam, Muhammad M.; Akimoto, Katsuhiro; Sakurai, Takeaki

    2018-02-01

    For copper indium gallium selenide [Cu(In1-x ,Ga x )Se2, CIGS]-based solar cells, defect states or impurity phase always form due to both the multinary compositions of CIGS film and the difficulty of controlling the growth process, especially for high Ga concentration. To further improve device performance, it is important to understand such formation of impurity phase or defect states during fabrication. In the work presented herein, the formation mechanism of impurity phase Cu2-δ Se and its depth profile in CIGS film with high Ga content, in particular CuGaSe2 (i.e., CGS), were investigated by applying different growth conditions (i.e., normal three-stage process and two-cycle three-stage process). The results suggest that impurity phase Cu2-δ Se is distributed nonuniformly in the film because of lack of Ga diffusion. The formed Cu2-δ Se can be removed by etching the as-deposited CGS film with bromine-methanol solution, resulting in improved device performance.

  8. Study on the depth profile analysis of Fe/Co intermixing in [SmCo{sub 5}/Fe]{sub 11} magnetic multilayers

    Energy Technology Data Exchange (ETDEWEB)

    Saravanan, P., E-mail: psdrdo@gmail.com [Defence Metallurgical Research Laboratory, Hyderabad 500058 (India); Department of Physics, National Taiwan University, Taipei 106, Taiwan (China); Hsu, Jen-Hwa, E-mail: jhhsu@phys.ntu.edu.tw [Department of Physics, National Taiwan University, Taipei 106, Taiwan (China); Perumal, A.; Gayen, Anabil [Department of Physics, Indian Institute of Technology Guwahati, Guwahati 781039 (India); Reddy, G.L.N.; Kumar, Sanjiv [National Centre for Compositional Characterization of Materials, Bhabha Atomic Research Centre, ECIL Post, Hyderabad 500062 (India); Kamat, S.V. [Defence Metallurgical Research Laboratory, Hyderabad 500058 (India)

    2014-09-01

    Multilayer films were sputtered on Si (1 0 0) substrate by following a layer sequence of Cr (10 nm)/[Fe (4 nm)/SmCo{sub 5} (20 nm)]{sub 11}/Cr (90 nm) at room temperature and subsequently, subjected to two-stage annealing. The phase composition, the extent of inter-diffusion at the SmCo{sub 5}/Fe interfaces and the magnetic properties of multilayered samples were investigated by X-ray diffraction (XRD), RBS and super-conducting quantum interference device (SQUID), respectively. The XRD studies showed the crystallization of SmCo{sub 5}-phase in the hard layer along with a bcc-Fe (Co)-phase in the soft layer, while the RBS depth profile analysis revealed the changes that occur in the effective Fe-layer thickness and diffused Co-content as minimal for the Fe-layer index, n{sub Fe}≤5. A single-phase behavior associated with strong in-plane anisotropy was evidenced with the SQUID measurements. The observed remanence enhancement (1020 kA/m) and energy product value (286 kJ/m{sup 3}) in these multilayers are discussed in the context of Fe-layer thickness and diffused Co-content.

  9. Profiling of Piper betle Linn. cultivars by direct analysis in real time mass spectrometric technique.

    Science.gov (United States)

    Bajpai, Vikas; Sharma, Deepty; Kumar, Brijesh; Madhusudanan, K P

    2010-12-01

    Piper betle Linn. is a traditional plant associated with the Asian and southeast Asian cultures. Its use is also recorded in folk medicines in these regions. Several of its medicinal properties have recently been proven. Phytochemical analysis showed the presence of mainly terpenes and phenols in betel leaves. These constituents vary in the different cultivars of Piper betle. In this paper we have attempted to profile eight locally available betel cultivars using the recently developed mass spectral ionization technique of direct analysis in real time (DART). Principal component analysis has also been employed to analyze the DART MS data of these betel cultivars. The results show that the cultivars of Piper betle could be differentiated using DART MS data. Copyright © 2010 John Wiley & Sons, Ltd.

  10. Square Wave Voltammetry: An Alternative Technique to Determinate Piroxicam Release Profiles from Nanostructured Lipid Carriers.

    Science.gov (United States)

    Otarola, Jessica; Garrido, Mariano; Correa, N Mariano; Molina, Patricia G

    2016-08-04

    A new, simple, and fast electrochemical (EC) method has been developed to determine the release profile of piroxicam, a nonsteroidal anti-inflammatory drug, loaded in a drug delivery system based on nanostructured lipid carriers (NLCs). For the first time, the samples were analyzed by using square wave voltammetry, a sensitive EC technique. The piroxicam EC responses allow us to propose a model that explains the experimental results and to subsequently determine the amount of drug loaded into the NLCs formulation as a function of time. In vitro drug release studies showed prolonged drug release (up to 5 days), releasing 60 % of the incorporated drug. The proposed method is a promising and stable alternative for the study of different drug delivery systems. © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  11. Beam profile measurements on the advanced test accelerator using optical techniques

    International Nuclear Information System (INIS)

    Chong, Y.P.; Kalibjian, R.; Cornish, J.P.; Kallman, J.S.; Donnelly, D.

    1986-01-01

    Beam current density profiles of ATA have been measured both spatially and temporally using a number of diagnostics. An extremely important technique involves measuring optical emissions from either a target foil inserted into the beam path or gas atoms and molecules excited by beam electrons. This paper describes the detection of the optical emission. A 2-D gated television camera with a single or dual micro-channel-plate (MCP) detector for high gain provides excellent spatial and temporal resolution. Measurements are routinely made with resolutions of 1 mm and 5 ns respectively. The optical line of sight allows splitting part of the signal to a streak camera or photometer for even higher time resolution

  12. The application of low angle Rutherford backscattering and channelling techniques to determine implantation induced disorder profile distributions in semiconductors

    International Nuclear Information System (INIS)

    Ahmed, N.A.G.; Christodoulides, C.E.; Carter, G.; Nobes, M.J.; Titov, A.I.

    1980-01-01

    Low angle exit (9 0 ) Rutherford backscattering geometry and channelling of 2 MeV 4 He + are employed to investigate the disorder depth profiles created by 40 keV N + implantation in (111) silicon and (100) GaAs targets. Parameters which can influence the disordering rate and its spatial distribution, such as ion fluence flux, substrate type and substrate temperature are examined. Under certain implantation conditions, the damage profile distributions are asymmetric - exhibiting a bimodal form in silicon targets or confined much closer to the GaAs surface than the normally expected mean range of 40 keV N + ions. (orig.)

  13. Spin reorientation transitions of Fe/Ni/Cu(001) studied by using the depth-resolved X-ray magnetic circular dichroism technique

    International Nuclear Information System (INIS)

    Abe, Hitoshi; Amemiya, Kenta; Matsumura, Daiju; Kitagawa, Soichiro; Watanabe, Hirokazu; Yokoyama, Toshihiko; Ohta, Toshiaki

    2006-01-01

    The spin reorientation transition (SRT) of Ni/Cu(001) induced by Fe deposition was investigated using the X-ray magnetic circular dichroism (XMCD) method. In-plane magnetized Ni films (= =10ML) also exhibit a transition to in-plane by 1-2ML Fe deposition. A precise magnetic anisotropy phase diagram was obtained using a combination of wedge-shaped Ni samples and stepwise Fe deposition. Magnetic anisotropy energies in the bulk, surface and interface layers of Ni films were separately determined using the depth-resolved XMCD technique, while values in the 1ML and 2ML portions of the Fe films were obtained from the conventional XMCD measurements. The origin of the SRTs is successfully explained with a simple phenomenological layer model using the obtained magnetic anisotropy energies. es

  14. Shallow Depth Geophysical Investigation Through the Application of Magnetic and Electric Resistance Techniques: AN Evaluation Study of the Responses of Magnetic and Electric Resistance Techniques to Archaeogeophysical Prospection Surveys in Greece and Cyprus

    Science.gov (United States)

    Sarris, Apostolos

    The response characteristics of total intensity and vertical gradient magnetic techniques have been investigated in detail and compared with electric resistivity and other geophysical techniques. Four case studies from archaeological sites of Greece and Cyprus have been used as the experimental basis of this research project. Data from shallow depth geophysical investigations in these sites were collected over a period of four years. Interpretation of the geophysical results was based on the integration of the various prospecting methods. The results of the comparative study between the different techniques showed a strong correlation among all methods allowing the detection of certain features and the determination of their dimensions. The application of a large range of geophysical prospecting techniques in the surveyed archaeological sites has been able to detect the approximate position of the subsurface remains and to compare the different techniques in terms of the information that they reveal. Each one of these techniques has been used to examine the characteristic response of each method to the geophysical anomalies associated with the surveyed sites. Magnetic susceptibility measurements at two frequencies have identified areas and levels of intense human activity. A number of processing techniques such as low, high and band pass filtering in the spatial and frequency domain, computation of the residuals and fast Fourier transformation (FFT) of the magnetic potential data have been applied to the geophysical measurements. The subsequent convolution with filters representing apparent susceptibility, reduction to pole and equator, Gaussian and Butterworth regional and residual distributions, and inverse filtering in terms of spiking deconvolution have revealed a wealth of information necessary to obtain a more accurate picture of the concealed features. Inverse modelling of isolated magnetic anomalies has further enriched the information database of the

  15. Temperature profile and water depth data collected from USS McInerney from expendable bathythermographs (XBT) in the Red Sea from 07 December 1992 to 28 December 1992 (NODC Accession 9300017)

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS McInerney in the Red Sea. Data were collected from 07 December 1992 to 28...

  16. Minimal interference beam size/profile measurement techniques applicable to the Collider

    International Nuclear Information System (INIS)

    Nexsen, W.; Dutt, S.; Kauffmann, S.; Lebedev, V.; Maschke, A.; Mokhov, N.; Richardson, R.; Tsyganov, E.; Zinchenko, A.

    1993-05-01

    The imaging of synchrotron radiation (SR) has been suggested as a technique for providing a continuous, non-interfering monitor of the beam profile in the Collider rings at the Superconducting Super Collider. A closer examination has raised questions concerning the applicability of SR imaging in this case because of the diffraction broadening of the image, the requirements for axial space and location in the lattice, and the complexity of the system. We have surveyed the known, alternative, minimal interference techniques for measuring beam size and have evaluated them for possible Collider usage. We conclude that of the approaches that appear feasible, all require at least some development for our usage and that the development of an electron beam probe offers the best promise. We recommend that flying wires be used for cross-checking and calibrating the electron beam probe diagnostic and for luminosity measurements when the highest accuracy is required, but flying wires should not be used as the primary diagnostic because of their limited lifetime

  17. Generation of DNA profiles from fingerprints developed with columnar thin film technique.

    Science.gov (United States)

    Plazibat, Stephanie L; Roy, Reena; Swiontek, Stephen E; Lakhtakia, Akhlesh

    2015-12-01

    Partial-bloody fingerprints and partial fingerprints with saliva are often encountered at crime scenes, potentially enabling the combination of fingerprint and DNA analyses for absolute identification, provided that the development technique for fingerprint analysis does not inhibit DNA analysis. 36 partial-bloody fingerprints and 30 fingerprints wetted with saliva, all deposited on brass, were first developed using the columnar-thin-film (CTF) technique and then subjected to short tandem repeat (STR) DNA analysis. Equal numbers of samples were subjected to the same DNA analysis without development. Tris (8-hydroxyquinolinato) aluminum, or Alq3, was evaporated to deposit CTFs for development of the prints. DNA was extracted from all 132 samples, quantified, and amplified with AmpFlSTR(®) Identifiler Plus Amplification Kit. Additionally, DNA analyses were conducted on four blood smears on un-fingerprinted brass that had been subjected to CTF deposition and four blood smears on un-fingerprinted brass that had not been subjected to CTF deposition. Complete and concordant autosomal STR profiles of the same quality were obtained from both undeveloped and CTF-developed fingerprints, indicating that CTF development of fingerprints preserves DNA and does not inhibit subsequent DNA analysis. Even when there were no fingerprints, CTF deposition did not lead to inhibition of DNA analysis. Copyright © 2015 Elsevier Ireland Ltd. All rights reserved.

  18. A comparative study of two techniques (electrocardiogram- and landmark-guided for correct depth of the central venous catheter placement in paediatric patients undergoing elective cardiovascular surgery

    Directory of Open Access Journals (Sweden)

    Neeraj Kumar Barnwal

    2016-01-01

    Full Text Available Background and Aims: The complications of central venous catheterisation can be minimized by ensuring catheter tip placement just above the superior vena cava-right atrium junction. We aimed to compare two methods, using an electrocardiogram (ECG or landmark as guides, for assessing correct depth of central venous catheter (CVC placement. Methods: In a prospective randomised study of sixty patients of <12 years of age, thirty patients each were allotted randomly to two groups (ECG and landmark. After induction, central venous catheterisation was performed by either of the two techniques and position of CVC tip was compared in post-operative chest X-ray with respect to carina. Unpaired t-test was used for quantitative data and Chi-square test was used for qualitative data. Results: In ECG group, positions of CVC tip were above carina in 12, at carina in 9 and below carina in 9 patients. In landmark group, the positions of CVC tips were above carina in 10, at carina in 4 and below carina in 16 patients. Mean distance of CVC tip in ECG group was 0.34 ± 0.23 cm and 0.66 ± 0.35 cm in landmark group (P = 0.0001. Complications occurred in one patient in ECG group and in nine patients in landmark group (P = 0.0056. Conclusion: Overall, landmark-guided technique was comparable with ECG technique. ECG-guided technique was more precise for CVC tip placement closer to carina. The incidence of complications was more in the landmark group.

  19. Non-destructive microstructural analysis with depth resolution

    Energy Technology Data Exchange (ETDEWEB)

    Zolotoyabko, E. E-mail: zloto@tx.technion.ac.il; Quintana, J.P

    2003-01-01

    A depth-sensitive X-ray diffraction technique has been developed with the aim of studying microstructural modifications in inhomogeneous polycrystalline materials. In that method, diffraction profiles are measured at different X-ray energies varied by small steps. X-rays at higher energies probe deeper layers of material. Depth-resolved structural information is retrieved by comparing energy-dependent diffraction profiles. The method provides non-destructive depth profiling of the preferred orientation, grain size, microstrain fluctuations and residual strains. This technique is applied to the characterization of seashells. Similarly, energy-variable X-ray diffraction can be used for the non-destructive characterization of different laminated structures and composite materials.

  20. Chemometric profile of root extracts of Rhodiola imbricata Edgew. with hyphenated gas chromatography mass spectrometric technique.

    Directory of Open Access Journals (Sweden)

    Amol B Tayade

    Full Text Available Rhodiola imbricata Edgew. (Rose root or Arctic root or Golden root or Shrolo, belonging to the family Crassulaceae, is an important food crop and medicinal plant in the Indian trans-Himalayan cold desert. Chemometric profile of the n-hexane, chloroform, dichloroethane, ethyl acetate, methanol, and 60% ethanol root extracts of R. imbricata were performed by hyphenated gas chromatography mass spectrometry (GC/MS technique. GC/MS analysis was carried out using Thermo Finnigan PolarisQ Ion Trap GC/MS MS system comprising of an AS2000 liquid autosampler. Interpretation on mass spectrum of GC/MS was done using the NIST/EPA/NIH Mass Spectral Database, with NIST MS search program v.2.0g. Chemometric profile of root extracts revealed the presence of 63 phyto-chemotypes, among them, 1-pentacosanol; stigmast-5-en-3-ol, (3β,24S; 1-teracosanol; 1-henteracontanol; 17-pentatriacontene; 13-tetradecen-1-ol acetate; methyl tri-butyl ammonium chloride; bis(2-ethylhexyl phthalate; 7,8-dimethylbenzocyclooctene; ethyl linoleate; 3-methoxy-5-methylphenol; hexadecanoic acid; camphor; 1,3-dimethoxybenzene; thujone; 1,3-benzenediol, 5-pentadecyl; benzenemethanol, 3-hydroxy, 5-methoxy; cholest-4-ene-3,6-dione; dodecanoic acid, 3-hydroxy; octadecane, 1-chloro; ethanone, 1-(4-hydroxyphenyl; α-tocopherol; ascaridole; campesterol; 1-dotriacontane; heptadecane, 9-hexyl were found to be present in major amount. Eventually, in the present study we have found phytosterols, terpenoids, fatty acids, fatty acid esters, alkyl halides, phenols, alcohols, ethers, alkanes, and alkenes as the major group of phyto-chemotypes in the different root extracts of R. imbricata. All these compounds identified by GC/MS analysis were further investigated for their biological activities and it was found that they possess a diverse range of positive pharmacological actions. In future, isolation of individual phyto-chemotypes and subjecting them to biological activity will definitely prove fruitful

  1. Micron Scale Mapping and Depth Profiling of Organic Compounds in Geologic Material: Femtosecond - Laser Desorption Laser Postionization - Mass Spectrometry (fs-LDPI-MS)

    Science.gov (United States)

    Pasterski, M. J.; Barry, G. E.; Hanley, L.; Kenig, F. P. H.

    2017-12-01

    One of the major challenges within the field of organic geochemistry is to determine whether an observed biomarker signature is indigenous (emplaced during sedimentation), non-indigenous (emplaced after sedimentation) or contaminant (incorporated during sampling, storage or analysis). The challenge of determining the mode of emplacement of an observed biomarker signature is accentuated in analyses of Precambrian samples, and may be an issue upon Mars sample return. Current geochemical techniques (e.g. gas chromatography-mass spectrometry, GC-MS, GC×GC-MS) can determine the composition and structure of the organic constituents of a sample. However, the preparatory steps necessary prior to GC-MS analysis (sample crushing, solvent extraction) make it impossible to determine the precise spatial distribution of organic molecules within rocks and sediments. Here, we will present data from the first set of micron (2-5 μm width × 8 μm depth) resolution MS-images of organic compounds in geologic material. Fs-LDPI-MS was utilized to create MS-images of organic compounds in four samples: (1) an Antarctic igneous dike used as a sample blank; (2) a 93 million year-old (Ma) burrowed carbonate collected near Pueblo, CO; (3) a 164 Ma organic rich mudstone collected in central England; and (4) a 2680 Ma metasediment collected in Timmins, ON, Canada. Prior to this study, all samples had been analyzed via GC-MS to determine the bulk hydrocarbon composition. For this study, thick sections (70-100 μm thick) were prepared in-house using custom-designed clean preparation techniques. Petrographic maps of the thick sections were created to highlight geologic features such as burrows (sample 2), particulate organic matter (sample 3) and hydrothermal veins (sample 4). Fs-LDPI-MS analysis was performed on the mapped thick sections. MS-images of targeted organic compounds were created, and the MS-images were overlain with the petrographic maps to determine the spatial distribution of the

  2. Characterization of the aroma profile of Madeira wine by sorptive extraction techniques.

    Science.gov (United States)

    Alves, R F; Nascimento, A M D; Nogueira, J M F

    2005-08-01

    The characterization of the aroma profile of 33 samples of Madeira wine from five monovarieties (Sercial, Verdelho, Boal, Malvasia and Tinta Negra Mole) having different type and categories is presented, using solid phase microextraction and stir bar sorptive extraction techniques (SPME and SBSE) followed by capillary gas chromatography and mass spectrometry detection (GC-MS). Headspace SPME/GC-MS provided effectiveness to identify the major constituents of the aroma profile of Madeira wine, where no remarkable differences occur among the samples studied. The volatile compounds are mainly constituted by ethyl octanoate (11.3-256.9μgL -1 ), ethyl decanoate (21.5-210.5μgL -1 ), ethyl decenoate (0.1-112.8μgL -1 ), diethyl succinate (0.9-65.6μgL -1 ), ethyl dodecanoate (1.2-6.5μgL -1 ), ethyl nonanoate (0.6-5.2μgL -1 ), ethyl hexanoate (0.2-3.7μgL -1 ) and isoamyl octanoate (0-2.2μgL -1 ). C 13 norisoprenoids such as vitispirane (0.9-7.0μgL -1 ) and 1,1,6-trimethyl 1,2-dihydro naphthalene (0.7-12.5μgL -1 ), as well as phenyl ethanol (0-8.1μgL -1 ), were also found in Madeira wine samples. The powerful capabilities of SBSE followed thermal desorption and GC-MS analysis allowed higher ability for profiling traces and ultra traces of compounds in Madeira wine samples, including esters (80.7-89.7%), carboxylic acids (1.6-4.2%), alcohols (3.5-8.2%), aldehydes (0.9-3.7%), pyrans (0.2-1.7%), lactones (sensorial threshold limits. Excellent correlation between Madeira wine ageing and the abundance of cis-oak lactone was attained showing to be an important chemical descriptor to characterize reserves and Vintages as well as a contributor to wine flavour. The differentiation between reserves, dry/medium dry and sweet/medium sweet young wines could be well established by means of chemometric analysis, using particular aroma compounds such as diethyl succinate, cis-oak lactone and ethyl octanoate as discriminating variables.

  3. Why bother about depth?

    DEFF Research Database (Denmark)

    Stæhr, Peter A.; Obrador, Biel; Christensen, Jesper Philip

    We present results from a newly developed method to determine depth specific rates of GPP, NEP and R using frequent automated profiles of DO and temperature. Metabolic rate calculations were made for three lakes of different trophic status using a diel DO methodology that integrates rates across...

  4. Profiles

    International Nuclear Information System (INIS)

    2004-01-01

    Profiles is a synthetic overview of more than 100 national energy markets in the world, providing insightful facts and key energy statistics. A Profile is structured around 6 main items and completed by key statistics: Ministries, public agencies, energy policy are concerned; main companies in the oil, gas, electricity and coal sectors, status, shareholders; reserve, production, imports and exports, electricity and refining capacities; deregulation of prices, subsidies, taxes; consumption trends by sector, energy market shares; main energy projects, production and consumption prospects. Statistical Profiles are present in about 3 pages the main data and indicators on oil, gas, coal and electricity. (A.L.B.)

  5. The loaded surface profile: a new technique for the investigation of contact surfaces

    OpenAIRE

    McBride, J.W.

    2006-01-01

    Contact between rough surfaces produces a complex contact profile. The contact area is usually estimated according to roughness statistics in conjunction withsurface models or by examining the surfaces before and after contact. Most of the existing literature on loaded surface profiles is theoretical or numerical in nature. This paper presents a methodology for a new system to measure the loaded surface profile, based on a non-contact 3D laser profiler. The system allows the measurement of...

  6. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

    NARCIS (Netherlands)

    Ingerle, D.; Meirer, F.; Pepponi, G.; Demenev, E.; Giubertoni, D.; Wobrauschek, P.; Streli, C.

    2014-01-01

    The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and

  7. Drill bit seismic, vertical seismic profiling, and seismic depth imaging to aid drilling decisions in the Tho Tinh structure, Nam Con Son basin, Vietnam

    Energy Technology Data Exchange (ETDEWEB)

    Borland, W; Hayashida, N; Kusaka, H; Leaney, W; Nakanishi, S

    1996-10-01

    This paper reviews the problem of overpressure, a common reason for acquiring look-ahead VSPs, and the seismic trace inversion problem, a fundamental issue in look-ahead prediction. The essential components of intermediate VSPs were examined from acquisition through processing to inversion, and recently acquired real data were provided, which were indicative of the advances being made toward developing an exclusive high resolution VSP service. A simple interpretation method and an end product of predicted mud weight versus depth were also presented, which were obtained from the inverted acoustic impedance and empirical relations. Of paramount importance in predicting the depth to a target was the velocity function used below the intermediate TD. The use of empirical or assumed density functions was an obvious weak link in the procedure. The advent of real-time time-depth measurements from drill bit seismic allowed a continuously updated predicted target depth below the present bit depth. 8 refs., 7 figs.

  8. Fluid flow profile in a packed bead column using residence time curves and radiotracer techniques

    Energy Technology Data Exchange (ETDEWEB)

    Almeida, Ana Paula F. de; Gonçalves, Eduardo Ramos; Brandão, Luis Eduardo B.; Salgado, Cesar M., E-mail: anacamiqui@gmail.com, E-mail: egoncalves@con.ufrj.br, E-mail: brandao@ien.gov.br, E-mail: otero@ien.gov.br [Instituto de Engenharia Nuclear (IEN/CNEN-RJ), Rio de Janeiro, RJ (Brazil)

    2017-07-01

    Filling columns are extremely important in the chemical industry and are used for purification, separation and treatment processes of gas or liquid mixtures. The objective of this work is to study the hydrodynamics of the fluid for a characterization of aqueous phase flow patterns in the filling column, associating with the methodology of the Curves of Residence Time Distribution (RTD) to analyze and associate theoretical models that put as conditions column operating. RTD can be obtained by using the pulse-stimulus response technique which is characterized by the instantaneous injection of a radiotracer into the system input. In this work, 68Ga was used as radiotracer. Five shielded and collimated NaI (Tl) 1 x 1″ scintillator detectors were suitably positioned to record the movement of the radiotracer's path in the conveying line and filling column. Making possible the analysis of the RTD curve in the regions of interest. With the data generated by the NaI (Tl) detectors with the passage of the radiotracer in the transport line and inside the column, it was possible to evaluate the flow profile of the aqueous phase and to identify operational failures, such as internal conduit and the existence of a retention zone in the inside the column. Theoretical models were used for different flow flows: the piston flow and perfect mixing. (author)

  9. Fluid flow profile in a packed bead column using residence time curves and radiotracer techniques

    International Nuclear Information System (INIS)

    Almeida, Ana Paula F. de; Gonçalves, Eduardo Ramos; Brandão, Luis Eduardo B.; Salgado, Cesar M.

    2017-01-01

    Filling columns are extremely important in the chemical industry and are used for purification, separation and treatment processes of gas or liquid mixtures. The objective of this work is to study the hydrodynamics of the fluid for a characterization of aqueous phase flow patterns in the filling column, associating with the methodology of the Curves of Residence Time Distribution (RTD) to analyze and associate theoretical models that put as conditions column operating. RTD can be obtained by using the pulse-stimulus response technique which is characterized by the instantaneous injection of a radiotracer into the system input. In this work, 68Ga was used as radiotracer. Five shielded and collimated NaI (Tl) 1 x 1″ scintillator detectors were suitably positioned to record the movement of the radiotracer's path in the conveying line and filling column. Making possible the analysis of the RTD curve in the regions of interest. With the data generated by the NaI (Tl) detectors with the passage of the radiotracer in the transport line and inside the column, it was possible to evaluate the flow profile of the aqueous phase and to identify operational failures, such as internal conduit and the existence of a retention zone in the inside the column. Theoretical models were used for different flow flows: the piston flow and perfect mixing. (author)

  10. Application of Spectral Analysis Techniques in the Intercomparison of Aerosol Data: Part III. Using Combined PCA to Compare Spatiotemporal Variability of MODIS, MISR and OMI Aerosol Optical Depth

    Science.gov (United States)

    Li, Jing; Carlson, Barbara E.; Lacis, Andrew A.

    2014-01-01

    Satellite measurements of global aerosol properties are very useful in constraining aerosol parameterization in climate models. The reliability of different data sets in representing global and regional aerosol variability becomes an essential question. In this study, we present the results of a comparison using combined principal component analysis (CPCA), applied to monthly mean, mapped (Level 3) aerosol optical depth (AOD) product from Moderate Resolution Imaging Spectroradiometer (MODIS), Multiangle Imaging Spectroradiometer (MISR), and Ozone Monitoring Instrument (OMI). This technique effectively finds the common space-time variability in the multiple data sets by decomposing the combined AOD field. The results suggest that all of the sensors capture the globally important aerosol regimes, including dust, biomass burning, pollution, and mixed aerosol types. Nonetheless, differences are also noted. Specifically, compared with MISR and OMI, MODIS variability is significantly higher over South America, India, and the Sahel. MODIS deep blue AOD has a lower seasonal variability in North Africa, accompanied by a decreasing trend that is not found in either MISR or OMI AOD data. The narrow swath of MISR results in an underestimation of dust variability over the Taklamakan Desert. The MISR AOD data also exhibit overall lower variability in South America and the Sahel. OMI does not capture the Russian wild fire in 2010 nor the phase shift in biomass burning over East South America compared to Central South America, likely due to cloud contamination and the OMI row anomaly. OMI also indicates a much stronger (boreal) winter peak in South Africa compared with MODIS and MISR.

  11. Development and Sensing Properties Study of Underwater Assembled Water Depth-Inclination Sensors for a Multi-Component Mooring System, Using a Self-Contained Technique

    Directory of Open Access Journals (Sweden)

    Wenhua Wu

    2016-11-01

    Full Text Available Prototype monitoring techniques play an important role in the safety guarantee of mooring systems in marine engineering. In general, the complexities of harsh ocean environmental conditions bring difficulties to the traditional monitoring methods of application, implementation and maintenance. Large amounts of existing mooring systems still lack valid monitoring strategies. In this paper, an underwater monitoring method which may be used to achieve the mechanical responses of a multi-point catenary mooring system, is present. A novel self-contained assembled water depth-inclination (D-I sensor is designed and manufactured. Several advanced technologies, such as standalone, low power consumption and synchronism, are considered to satisfy the long-term implementation requirements with low cost during the design process. The design scheme of the water resistance barrel and installation clamp, which satisfies the diver installation, are also provided in the paper. An on-site test has previously been carried out on a production semisubmersible platform in the South China Sea. The prototype data analyses, including the D-I value in the time domain (including the data recorded during the mooring retraction and release process and spectral characteristics, are presented to reveal the accuracy, feasibility and stability of the sensor in terms of fitting for the prototype monitoring of catenary mooring systems, especially for in-service aging platforms.

  12. Application of constrained deconvolution technique for reconstruction of electron bunch profile with strongly non-Gaussian shape

    Science.gov (United States)

    Geloni, G.; Saldin, E. L.; Schneidmiller, E. A.; Yurkov, M. V.

    2004-08-01

    An effective and practical technique based on the detection of the coherent synchrotron radiation (CSR) spectrum can be used to characterize the profile function of ultra-short bunches. The CSR spectrum measurement has an important limitation: no spectral phase information is available, and the complete profile function cannot be obtained in general. In this paper we propose to use constrained deconvolution method for bunch profile reconstruction based on a priori-known information about formation of the electron bunch. Application of the method is illustrated with practically important example of a bunch formed in a single bunch-compressor. Downstream of the bunch compressor the bunch charge distribution is strongly non-Gaussian with a narrow leading peak and a long tail. The longitudinal bunch distribution is derived by measuring the bunch tail constant with a streak camera and by using a priory available information about profile function.

  13. Application of constrained deconvolution technique for reconstruction of electron bunch profile with strongly non-Gaussian shape

    International Nuclear Information System (INIS)

    Geloni, G.; Saldin, E.L.; Schneidmiller, E.A.; Yurkov, M.V.

    2004-01-01

    An effective and practical technique based on the detection of the coherent synchrotron radiation (CSR) spectrum can be used to characterize the profile function of ultra-short bunches. The CSR spectrum measurement has an important limitation: no spectral phase information is available, and the complete profile function cannot be obtained in general. In this paper we propose to use constrained deconvolution method for bunch profile reconstruction based on a priori-known information about formation of the electron bunch. Application of the method is illustrated with practically important example of a bunch formed in a single bunch-compressor. Downstream of the bunch compressor the bunch charge distribution is strongly non-Gaussian with a narrow leading peak and a long tail. The longitudinal bunch distribution is derived by measuring the bunch tail constant with a streak camera and by using a priory available information about profile function

  14. Intercomparison of stratospheric temperature profiles from a ground-based microwave radiometer with other techniques

    Directory of Open Access Journals (Sweden)

    F. Navas-Guzmán

    2017-11-01

    Full Text Available In this work the stratospheric performance of a relatively new microwave temperature radiometer (TEMPERA has been evaluated. With this goal in mind, almost 3 years of temperature measurements (January 2014–September 2016 from the TEMPERA radiometer were intercompared with simultaneous measurements from other techniques: radiosondes, MLS satellite and Rayleigh lidar. This intercomparison campaign was carried out at the aerological station of MeteoSwiss at Payerne (Switzerland. In addition, the temperature profiles from TEMPERA were used to validate the temperature outputs from the SD-WACCM model. The results showed in general a very good agreement between TEMPERA and the different instruments and the model, with a high correlation (higher than 0.9 in the temperature evolution at different altitudes between TEMPERA and the different data sets. An annual pattern was observed in the stratospheric temperature with generally higher temperatures in summer than in winter and with a higher variability during winter. A clear change in the tendency of the temperature deviations was detected in summer 2015, which was due to the repair of an attenuator in the TEMPERA spectrometer. The mean and the standard deviations of the temperature differences between TEMPERA and the different measurements were calculated for two periods (before and after the repair in order to quantify the accuracy and precision of this radiometer over the campaign period. The results showed absolute biases and standard deviations lower than 2 K for most of the altitudes. In addition, comparisons proved the good performance of TEMPERA in measuring the temperature in the stratosphere.

  15. PDEPTH—A computer program for the geophysical interpretation of magnetic and gravity profiles through Fourier filtering, source-depth analysis, and forward modeling

    Science.gov (United States)

    Phillips, Jeffrey D.

    2018-01-10

    PDEPTH is an interactive, graphical computer program used to construct interpreted geological source models for observed potential-field geophysical profile data. The current version of PDEPTH has been adapted to the Windows platform from an earlier DOS-based version. The input total-field magnetic anomaly and vertical gravity anomaly profiles can be filtered to produce derivative products such as reduced-to-pole magnetic profiles, pseudogravity profiles, pseudomagnetic profiles, and upward-or-downward-continued profiles. A variety of source-location methods can be applied to the original and filtered profiles to estimate (and display on a cross section) the locations and physical properties of contacts, sheet edges, horizontal line sources, point sources, and interface surfaces. Two-and-a-half-dimensional source bodies having polygonal cross sections can be constructed using a mouse and keyboard. These bodies can then be adjusted until the calculated gravity and magnetic fields of the source bodies are close to the observed profiles. Auxiliary information such as the topographic surface, bathymetric surface, seismic basement, and geologic contact locations can be displayed on the cross section using optional input files. Test data files, used to demonstrate the source location methods in the report, and several utility programs are included.

  16. Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films

    Czech Academy of Sciences Publication Activity Database

    Aulika, I.; Mergen, S.; Bencan, A.; Zhang, Q.; Dejneka, Alexandr; Kosec, M.; Kundzins, K.; Demarchi, D.; Civera, P.

    2013-01-01

    Roč. 112, č. 1 (2013), s. 53-58 ISSN 1743-6753 R&D Projects: GA TA ČR TA01010517; GA ČR GAP108/12/1941 Institutional research plan: CEZ:AV0Z10100522 Keywords : compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.107, year: 2013

  17. An unsupervised technique for optimal feature selection in attribute profiles for spectral-spatial classification of hyperspectral images

    Science.gov (United States)

    Bhardwaj, Kaushal; Patra, Swarnajyoti

    2018-04-01

    Inclusion of spatial information along with spectral features play a significant role in classification of remote sensing images. Attribute profiles have already proved their ability to represent spatial information. In order to incorporate proper spatial information, multiple attributes are required and for each attribute large profiles need to be constructed by varying the filter parameter values within a wide range. Thus, the constructed profiles that represent spectral-spatial information of an hyperspectral image have huge dimension which leads to Hughes phenomenon and increases computational burden. To mitigate these problems, this work presents an unsupervised feature selection technique that selects a subset of filtered image from the constructed high dimensional multi-attribute profile which are sufficiently informative to discriminate well among classes. In this regard the proposed technique exploits genetic algorithms (GAs). The fitness function of GAs are defined in an unsupervised way with the help of mutual information. The effectiveness of the proposed technique is assessed using one-against-all support vector machine classifier. The experiments conducted on three hyperspectral data sets show the robustness of the proposed method in terms of computation time and classification accuracy.

  18. CRED Acoustic Doppler Profiler (ADP); AMSM, ROS; Long: -168.15481, Lat: -14.53510 (WGS84); Sensor Depth: 7.01m; Data Range: 20080311-20080314.

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Data from Coral Reef Ecosystem Division (CRED), NOAA Pacific Island Fisheries Science Center Acoustic Doppler Profilers (ADP) provide a time series of water current...

  19. CRED Acoustic Doppler Profiler (ADP); NWHI, MID; Long: -177.42181, Lat: 28.21826 (WGS84); Sensor Depth: 1.83m; Data Range: 20080926-20090321.

    Data.gov (United States)

    National Oceanic and Atmospheric Administration, Department of Commerce — Data from Coral Reef Ecosystem Division (CRED), NOAA Pacific Island Fisheries Science Center Acoustic Doppler Profilers (ADP) provide a time series of water current...

  20. Nondestructive measurement of refractive index profile of optical fiber preforms using moire technique and phase shift method

    Science.gov (United States)

    Ranjbar, Samaneh; Khalesifard, Hamid R.; Rasouli, Saifollah

    2006-01-01

    The refractive index profile of optical fiber preform is measured by a nondestructive technique based on Talbot interferometry. In this technique the preform is placed between two ronchi ruling gratings of 10 lines/mm and the system is illuminated by an expanded and collimated beam of He-Ne laser. In this arrangement the 2nd grating is positioned in the Talbot image of the 1st grating and the preform axis is parallel to the gratings planes. To eliminate the effect of clad on the light beam deflection during the measurements, the preform is immersed in an index matching liquid. The phase front of the laser light over the 2nd grating can be monitored by analysis of the moire pattern which is formed over there. The analysis is done by means of 4-step phase shift technique. In this technique the second grating is moved in four steps of 1/4 of the grating vector and in each step the intensity profile of the moire pattern is recorded. The phasefront can be specified by using the recorded intensities. The refractive index profile of the preform can be calculated from the changes on phasefront while the preform is placed between the gratings respect to the case when it is absent. The whole procedure is automated and computer controlled by using a CCD camera to record the moire fringes, a stepper motor for linear translation of the 2nd grating and a code in MATLAB to control the system and measurements.

  1. Determination of Cation Distributions in Mineral Structures by use of the Rietveld Full-Profile Refinement Technique

    International Nuclear Information System (INIS)

    Nord, A.G.

    1986-01-01

    Use of the Rietveld full-profile refinement technique with X-ray or neutron powder diffraction data for the determination of divalent-metal cation distributions in three mineral structure types (farringtonite, grafonite, sarcopside) is demonstrated. The accuracy of the conventional cation distribution coefficient Ksub(D) is about 5-10 percent with 24-46 parameters to be refined, and the averaged metal-oxygen distances are reliable and well correlated to the observed cation distribution pattern. In particular the usefulness of the Rietveld technique in combination with Moessbauer spectroscopy is stressed. Some concluding remarks are also given

  2. Analysis of Sidestream Smoke VOCs and Characterization of their Odor Profiles by VOC Preconcentrator-GC-O Techniques

    Directory of Open Access Journals (Sweden)

    Higashi N

    2014-12-01

    Full Text Available Various techniques have been employed in the analysis of volatile organic compounds (VOCs. However, these techniques are insufficient for the precise analysis of tobacco smoke VOCs because of the complexity of the operating system, system instability, or poor sensitivity. To overcome these problems, a combined system of VOC preconcentrator, gas chromatograph, and olfactometer has been developed. The performance of this new system was evaluated in the analysis of VOCs in tobacco smoke and applied to the odor profiling of sidestream smoke (SSS that has not been sufficiently investigated in the past.

  3. Determining of electron temperature profile on the cross section of a Tokamak, using ECE technique

    Directory of Open Access Journals (Sweden)

    M. Hosseinpour

    2007-06-01

    Full Text Available  In this paper we have used plasma electron cyclotron emissions at the second harmonic frequency of extraordinary mode to determine the temperature profile of the plasma produced in IR-T1 Tokamak. The emissions obtained at different frequencies by a 5-channel heterodyne receiver, have been analyzed to determine the spatial variation of the electron temperature on the plasma cross section. The results have been also used to show the three-dimensional time evolution of the temperature profile during the period of confinement.

  4. Opto-thermal transient emission radiometry for rapid, non-destructive and non-contact determination of hydration and hydration depth profile in the skin of a grape

    NARCIS (Netherlands)

    Guo, X.; Bicanic, D.D.; Keijser, K.; Imhof, R.

    2003-01-01

    .The concept of optothermal transient emission radiometry at a wavelength of 2.94 µm was applied to non-destructively determine the level of hydration and the profile of hydration in the skin of intact fresh grapes taken from top and bottom sections of the same bunch.

  5. Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device

    Science.gov (United States)

    Creely, A. J.; Ida, K.; Yoshinuma, M.; Tokuzawa, T.; Tsujimura, T.; Akiyama, T.; Sakamoto, R.; Emoto, M.; Tanaka, K.; Michael, C. A.

    2017-07-01

    A new method for measuring density fluctuation profiles near the edge of plasmas in the Large Helical Device (LHD) has been developed utilizing reflectometry combined with pellet-induced fast density scans. Reflectometer cutoff location was calculated by proportionally scaling the cutoff location calculated with fast far infrared laser interferometer (FIR) density profiles to match the slower time resolution results of the ray-tracing code LHD-GAUSS. Plasma velocity profile peaks generated with this reflectometer mapping were checked against velocity measurements made with charge exchange spectroscopy (CXS) and were found to agree within experimental uncertainty once diagnostic differences were accounted for. Measured density fluctuation profiles were found to peak strongly near the edge of the plasma, as is the case in most tokamaks. These measurements can be used in the future to inform inversion methods of phase contrast imaging (PCI) measurements. This result was confirmed with both a fixed frequency reflectometer and calibrated data from a multi-frequency comb reflectometer, and this method was applied successfully to a series of discharges. The full width at half maximum of the turbulence layer near the edge of the plasma was found to be only 1.5-3 cm on a series of LHD discharges, less than 5% of the normalized minor radius.

  6. Improving Focal Depth Estimates: Studies of Depth Phase Detection at Regional Distances

    Science.gov (United States)

    Stroujkova, A.; Reiter, D. T.; Shumway, R. H.

    2006-12-01

    The accurate estimation of the depth of small, regionally recorded events continues to be an important and difficult explosion monitoring research problem. Depth phases (free surface reflections) are the primary tool that seismologists use to constrain the depth of a seismic event. When depth phases from an event are detected, an accurate source depth is easily found by using the delay times of the depth phases relative to the P wave and a velocity profile near the source. Cepstral techniques, including cepstral F-statistics, represent a class of methods designed for the depth-phase detection and identification; however, they offer only a moderate level of success at epicentral distances less than 15°. This is due to complexities in the Pn coda, which can lead to numerous false detections in addition to the true phase detection. Therefore, cepstral methods cannot be used independently to reliably identify depth phases. Other evidence, such as apparent velocities, amplitudes and frequency content, must be used to confirm whether the phase is truly a depth phase. In this study we used a variety of array methods to estimate apparent phase velocities and arrival azimuths, including beam-forming, semblance analysis, MUltiple SIgnal Classification (MUSIC) (e.g., Schmidt, 1979), and cross-correlation (e.g., Cansi, 1995; Tibuleac and Herrin, 1997). To facilitate the processing and comparison of results, we developed a MATLAB-based processing tool, which allows application of all of these techniques (i.e., augmented cepstral processing) in a single environment. The main objective of this research was to combine the results of three focal-depth estimation techniques and their associated standard errors into a statistically valid unified depth estimate. The three techniques include: 1. Direct focal depth estimate from the depth-phase arrival times picked via augmented cepstral processing. 2. Hypocenter location from direct and surface-reflected arrivals observed on sparse

  7. Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma

    Directory of Open Access Journals (Sweden)

    C. N. Taylor

    2017-05-01

    Full Text Available Understanding tritium retention and permeation in plasma-facing components is critical for fusion safety and fuel cycle control. Glow discharge optical emission spectroscopy (GD-OES is shown to be an effective tool to reveal the depth profile of deuterium in tungsten. Results confirm the detection of deuterium. A ∼46 μm depth profile revealed that the deuterium content decreased precipitously in the first 7 μm, and detectable amounts were observed to depths in excess of 20 μm. The large probing depth of GD-OES (up to 100s of μm enables studies not previously accessible to the more conventional techniques for investigating deuterium retention. Of particular applicability is the use of GD-OES to measure the depth profile for experiments where high deuterium concentration in the bulk material is expected: deuterium retention in neutron irradiated materials, and ultra-high deuterium fluences in burning plasma environment.

  8. Multiple Tracer ({sup 4}He, {sup 14}C, {sup 39}Ar, {sup 3}H/{sup 3}He, {sup 85}Kr) Depth Profile in an Extensively Exploited Multilevel Aquifer System in the Venetian Plain, Italy

    Energy Technology Data Exchange (ETDEWEB)

    Mayer, A.; Claude, C [Centre Europeen de Recherche et d' Enseignement des Geosciences de l' Environnement, Aix-en-Provence (France); Purtschert, R. [Climate and Environmental Physics, University of Bern (Switzerland); Sueltenfuss, J. [Institute of Environmental Physics, University of Bremen (Germany); Travi, Y. [UMR-EMMAH, Universite d' Avignon et des Pays de Vaucluse, Avignon (France)

    2013-07-15

    Individual dating tracers have their specific inherent properties, advantages and limitations. Apparent {sup 4}He accumulation ages are biased as a function of a prior unknown external helium influx; {sup 14}C (T{sub 1/2}: 5730 a) dating in groundwater requires suitable geochemical correction schemes and {sup 39}Ar (T{sub 1/2}: 269 a) may be affected by underground production. In a multiple tracer study in the Venetian Plain, Italy, using {sup 4}He, {sup 14}C. {sup 39}Ar {sup 3}H/{sup 3}He and {sup 85}Kr data, the groundwater residence times in a depth profile consisting of different separated aquifers between 50-350 m depth are estimated. Moreover, limitations and uncertainties of the applied tracer methods are identified, assessed and quantified. (author)

  9. Improving depth resolutions in positron beam spectroscopy by concurrent ion-beam sputtering

    Science.gov (United States)

    John, Marco; Dalla, Ayham; Ibrahim, Alaa M.; Anwand, Wolfgang; Wagner, Andreas; Böttger, Roman; Krause-Rehberg, Reinhard

    2018-05-01

    The depth resolution of mono-energetic positron annihilation spectroscopy using a positron beam is shown to improve by concurrently removing the sample surface layer during positron beam spectroscopy. During ion-beam sputtering with argon ions, Doppler-broadening spectroscopy is performed with energies ranging from 3 keV to 5 keV allowing for high-resolution defect studies just below the sputtered surface. With this technique, significantly improved depth resolutions could be obtained even at larger depths when compared to standard positron beam experiments which suffer from extended positron implantation profiles at higher positron energies. Our results show that it is possible to investigate layered structures with a thickness of about 4 microns with significantly improved depth resolution. We demonstrated that a purposely generated ion-beam induced defect profile in a silicon sample could be resolved employing the new technique. A depth resolution of less than 100 nm could be reached.

  10. Detection of irradiated beef by nuclear magnetic resonance lipid profiling combined with chemometric techniques.

    Science.gov (United States)

    Zanardi, Emanuela; Caligiani, Augusta; Padovani, Enrico; Mariani, Mario; Ghidini, Sergio; Palla, Gerardo; Ianieri, Adriana

    2013-02-01

    The combination of (1)H NMR lipid profiling with multivariate analysis was applied to differentiate irradiated and non-irradiated beef. Two pattern recognition chemometric procedures, stepwise linear discriminant analysis (sLDA) and artificial neural networks (ANNs), provided a successful discrimination between the groups investigated. sLDA allowed the classification of 100% of the samples into irradiated or non-irradiated beef groups; the same result was obtained by ANNs using the 1 kGy irradiation dose as discriminant value suggested by the network. Furthermore, sLDA allowed the classification of 81.9% of the beef samples according to the irradiation dose (0, 2.5, 4.5 and 8 kGy). (1)H NMR lipid profiling, coupled with multivariate analysis may be considered a suitable and promising screening tool for the rapid detection of irradiated meat in official control of food. Copyright © 2012 Elsevier Ltd. All rights reserved.

  11. Preferred crystallite orientations depth profile in the two phase alloy Zn-22% wt Al, determined by X-ray and neutron diffraction

    International Nuclear Information System (INIS)

    Palacios G, J.; Casas E, J.L.; Ita, A. de

    1998-01-01

    In order to observe the texture inhomogeneity of the Zn-22% wt Al alloy, polar figures for the α -phase (111) and β -phase (002) reflections were measured by X-ray diffraction at four different depths in a hot rolled sheet sample. Also a sample in the form of a cube was assembled with several pieces of the sheet, with the same degree of deformation, to make it suitable for the measurement of its polar figures by means of neutron diffraction. In both phases, the corresponding typical rolling texture was observed. Therefore, it does not seem to exist any strong correlation between preferred orientations in both phases, as it might be expected. β -phase polar figures show a homogeneous texture, with a very small increasing orientation dispersion related to depth. The α -phase polar figures are very weak and they vary statistically but retaining the main characteristics of hot rolling polar figures. Neutron diffraction polar figures were also obtained and the results are in good agreement with the X-ray polar figures. Probably, easy grain boundary sliding, which is one of the main mechanisms of superplasticity in this alloy, is also responsible for a homogeneous distribution of strain and stress in the bulk of the sample. (Author)

  12. Plumbing the depths: Utilizing O and G reserve profiles to develop forward-looking risk assessments for exploration and production activities

    International Nuclear Information System (INIS)

    Botelho, Tatiana; Magrini, Alessandra; Schaeffer, Roberto

    2014-01-01

    The deepwater horizon accident may have shaken the sustainability ratings and indices credibility, but it also reinforced their importance. The objective of this article is to contribute to the improvement of corporate sustainability valuations by investigating if reserves profiles can affect the environmental risk exposure of an Oil and Gas (O and G) corporation. Data on reserves from 2009 to 2012 of 24 listed O and G companies were used to test six hypotheses, addressing how these profiles could relate to the four material environmental risks: climate change, accidents, sensitive area/access, water. The frequency with which companies reported these risks was evaluated using key word in context (KWIC) content analysis. Analysis of variance (Anova) and Student's t tests were applied to each of the hypotheses. This study shows environmental risks are embedded with the oil and gas reserves. We found the following relationships: (1) companies with heavy oil reserves report more exposure to climate change risks, particularly emissions control; (2) water is more of an issue with companies with higher bitumen and natural gas reserves; and (3) there is significant regional bias in the reporting of the environmental risk factors. These findings have broad implications for the financial industry, governments, investors and lenders alike. - Highlights: • We explored if reserve profile can also be used as a factor to evaluate environmental risk. • Companies with heavy oil reserves report more exposure to climate change risks. • Water is more of an issue with companies with higher bitumen and natural gas reserves. • There is significant regional bias in the reporting of the environmental risk factors

  13. An integrated strategy for in vivo metabolite profiling using high-resolution mass spectrometry based data processing techniques

    International Nuclear Information System (INIS)

    Guo, Jian; Zhang, Minli; Elmore, Charles S.; Vishwanathan, Karthick

    2013-01-01

    Graphical abstract: -- Highlights: •Profiling the metabolites of model compounds in rats using high resolution mass spectrometry based data processing techniques. •Demonstrating an integrated strategy in vivo metabolite profiling using data mining tools. •Unusual metabolites generated via thiazole-ring opening were characterized based on processed LC–MS.data. -- Abstract: An ongoing challenge of drug metabolite profiling is to detect and identify unknown or low-level metabolites in complex biological matrices. Here we present a generic strategy for metabolite detection using multiple accurate-mass-based data processing tools via the analysis of rat samples of two model drug candidates, AZD6280 and AZ12488024. First, the function of isotopic pattern recognition was proved to be highly effective in the detection of metabolites derived from [ 14 C]-AZD6280 that possesses a distinct isotopic pattern. The metabolites revealed using this approach were in excellent qualitative correlation to those observed in radiochromatograms. Second, the effectiveness of accurate mass based untargeted data mining tools such as background subtraction, mass defect filtering, or a data mining package (MZmine) used for metabolomic analysis in detection of metabolites of [ 14 C]-AZ12488024 in rat urine, feces, bile and plasma samples was examined and a total of 33 metabolites of AZ12488024 were detected. Among them, at least 16 metabolites were only detected by the aid of the data mining packages and not via radiochromatograms. New metabolic pathways such as S-oxidation and thiomethylation reactions occurring on the thiazole ring were proposed based on the processed data. The results of these experiments also demonstrated that accurate mass-based mass defect filtering (MDF) and data mining techniques used in metabolomics are complementary and can be valuable tools for delineating low-level metabolites in complex matrices. Furthermore, the application of distinct multiple data

  14. Oxygen depth profiling in Kr+-implanted polycrystalline alpha titanium by means of 16O(α,α)16O resonance scattering

    International Nuclear Information System (INIS)

    Nsengiyumva, S.; Riviere, J.P.; Raji, A.T.; Comrie, C.M.; Britton, D.T.; Haerting, M.

    2011-01-01

    The 16 O(α,α) 16 O resonance scattering was applied to study the effects of ion implantation on the oxygen distribution in the near surface region of polycrystalline titanium implanted with 180 keV krypton ions at fluences, ranging between 1 x 10 14 and 5 x 10 15 Kr + /cm 2 . Two sample sets were chosen: as-received polycrystalline titanium discs rolled and annealed in half-hard condition which had a thick oxygen layer and similar samples in which this surface layer was removed by polishing. An increase of the mean oxygen concentration observed in both unpolished and polished samples at low fluence suggests a knock-on implantation of surface oxygen atoms. At high fluence, an overall decrease in the mean oxygen concentration and mean oxygen depth suggests an out-diffusion of near-surface oxygen atoms.

  15. Oxygen depth profiling in Kr{sup +}-implanted polycrystalline alpha titanium by means of {sup 16}O({alpha},{alpha}){sup 16}O resonance scattering

    Energy Technology Data Exchange (ETDEWEB)

    Nsengiyumva, S., E-mail: schadnse@hotmail.com [Department of Physics, University of Cape Town, Rondebosch 7701 (South Africa); Department of Physics and Electronics, Rhodes University, Grahamstown 6140 (South Africa); Department of Physics, Kigali Institute of Education, P.O. Box 5039 Kigali (Rwanda); Riviere, J.P. [Laboratoire de Physique des Materiaux UMR6630-CNRS, 86960 (France); Raji, A.T.; Comrie, C.M.; Britton, D.T.; Haerting, M. [Department of Physics, University of Cape Town, Rondebosch 7701 (South Africa)

    2011-07-15

    The {sup 16}O({alpha},{alpha}){sup 16}O resonance scattering was applied to study the effects of ion implantation on the oxygen distribution in the near surface region of polycrystalline titanium implanted with 180 keV krypton ions at fluences, ranging between 1 x 10{sup 14} and 5 x 10{sup 15} Kr{sup +}/cm{sup 2}. Two sample sets were chosen: as-received polycrystalline titanium discs rolled and annealed in half-hard condition which had a thick oxygen layer and similar samples in which this surface layer was removed by polishing. An increase of the mean oxygen concentration observed in both unpolished and polished samples at low fluence suggests a knock-on implantation of surface oxygen atoms. At high fluence, an overall decrease in the mean oxygen concentration and mean oxygen depth suggests an out-diffusion of near-surface oxygen atoms.

  16. Multiple scattering effects in depth resolution of elastic recoil detection

    International Nuclear Information System (INIS)

    Wielunski, L.S.; Harding, G.L.

    1998-01-01

    Elastic Recoil Detection (ERD) is used to profile hydrogen and other low mass elements in thin films at surface and interfaces in a similar way that Rutherford Backscattering Spectroscopy (RBS) is used to detect and profile heavy elements. It is often assumed that the depth resolutions of these two techniques are similar. However, in contrast to typical RBS, the depth resolution of ERD is limited substantially by multiple scattering. In experimental data analysis and/or spectra simulations of a typical RBS measurement multiple scattering effects are often ignored. Computer programs used in IBA, such as RUMP, HYPRA or RBX do not include multiple scattering effects at all. In this paper, using practical thin metal structures with films containing intentionally introduced hydrogen, we demonstrate experimental ERD depth resolution and sensitivity limitations. The effects of sample material and scattering angle are also discussed. (authors)

  17. Multiple scattering effects in depth resolution of elastic recoil detection

    Energy Technology Data Exchange (ETDEWEB)

    Wielunski, L.S.; Harding, G.L. [Commonwealth Scientific and Industrial Research Organisation (CSIRO), Lindfield, NSW (Australia). Telecommunications and Industrial Physics; Szilagyi, E. [KFKI Research Institute for Particle and Nuclear Physics, Budapest, (Hungary)

    1998-06-01

    Elastic Recoil Detection (ERD) is used to profile hydrogen and other low mass elements in thin films at surface and interfaces in a similar way that Rutherford Backscattering Spectroscopy (RBS) is used to detect and profile heavy elements. It is often assumed that the depth resolutions of these two techniques are similar. However, in contrast to typical RBS, the depth resolution of ERD is limited substantially by multiple scattering. In experimental data analysis and/or spectra simulations of a typical RBS measurement multiple scattering effects are often ignored. Computer programs used in IBA, such as RUMP, HYPRA or RBX do not include multiple scattering effects at all. In this paper, using practical thin metal structures with films containing intentionally introduced hydrogen, we demonstrate experimental ERD depth resolution and sensitivity limitations. The effects of sample material and scattering angle are also discussed. (authors). 19 refs., 4 figs.

  18. Determination of multi-element profiles of soil at Visakhapatnam using EDXRF technique

    International Nuclear Information System (INIS)

    Sandeep, P.; Kothai, P.; Dusane, C.B.; Sahu, S.K.; Pandit, G.G.

    2014-01-01

    In the present study attempt has been made to generate elemental profile database for major sources of soil pollution, specific to Visakhapatnam. Representative road dust and soil samples from major industrial locations were collected and analyzed for various metals distribution using EDXRF. Analysis results indicate that V and Ni were predominant at PR and Zn was found to be dominating in road dust samples. Higher concentration of Arsenic was observed at TPP as compared to all other sites. Cr was found to be dominating at TPP and SP. I geo calculations suggest that soil is highly contaminated with heavy metal pollutants. (author)

  19. Improving electronic customers' profile in recommender systems using data mining techniques

    Directory of Open Access Journals (Sweden)

    Mohammad Julashokri

    2011-10-01

    Full Text Available Recommender systems are tools for realization one to one marketing. Recommender systems are systems, which attract, retain, and develop customers. Recommender systems use several ways to make recommendations. Two ways are using more than the others: collaborative filtering and content-based filtering. In this study, a recommender system model based on collaborative filtering has proposed. Proposed model was endeavored to improve the customer profile in collaborative systems to enhance the recommender system efficiency. This improvement was done using time context and group preferences. Experimental results show that the proposed model has a better recommendation performance than existing models.

  20. Blur kernel estimation with algebraic tomography technique and intensity profiles of object boundaries

    Science.gov (United States)

    Ingacheva, Anastasia; Chukalina, Marina; Khanipov, Timur; Nikolaev, Dmitry

    2018-04-01

    Motion blur caused by camera vibration is a common source of degradation in photographs. In this paper we study the problem of finding the point spread function (PSF) of a blurred image using the tomography technique. The PSF reconstruction result strongly depends on the particular tomography technique used. We present a tomography algorithm with regularization adapted specifically for this task. We use the algebraic reconstruction technique (ART algorithm) as the starting algorithm and introduce regularization. We use the conjugate gradient method for numerical implementation of the proposed approach. The algorithm is tested using a dataset which contains 9 kernels extracted from real photographs by the Adobe corporation where the point spread function is known. We also investigate influence of noise on the quality of image reconstruction and investigate how the number of projections influence the magnitude change of the reconstruction error.