Accurate and precise measurement of oxygen isotopic fractions and diffusion profiles by selective attenuation of secondary ions (SASI).

Science.gov (United States)

Téllez, Helena; Druce, John; Hong, Jong-Eun; Ishihara, Tatsumi; Kilner, John A

2015-03-03

The accuracy and precision of isotopic analysis in Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) relies on the appropriate reduction of the dead-time and detector saturation effects, especially when analyzing species with high ion yields or present in high concentrations. Conventional approaches to avoid these problems are based on Poisson dead-time correction and/or an overall decrease of the total secondary ion intensity by reducing the target current. This ultimately leads to poor detection limits for the minor isotopes and high uncertainties of the measured isotopic ratios. An alternative strategy consists of the attenuation of those specific secondary ions that saturate the detector, providing an effective extension of the linear dynamic range. In this work, the selective attenuation of secondary ion signals (SASI) approach is applied to the study of oxygen transport properties in electroceramic materials by isotopic labeling with stable (18)O tracer and ToF-SIMS depth profiling. The better analytical performance in terms of accuracy and precision allowed a more reliable determination of the oxygen surface exchange and diffusion coefficients while maintaining good mass resolution and limits of detection for other minor secondary ion species. This improvement is especially relevant to understand the ionic transport mechanisms and properties of solid materials, such as the parallel diffusion pathways (e.g., oxygen diffusion through bulk, grain boundary, or dislocations) in electroceramic materials with relevant applications in energy storage and conversion devices.

Irradiation effects on secondary structure of protein induced by keV ions

International Nuclear Information System (INIS)

Cui, F.Z.; Lin, Y.B.; Zhang, D.M.; Tian, M.B.

2001-01-01

Protein secondary structure changes by low-energy ion irradiation are reported for the first time. The selected system is 30 keV N + irradiation on bovine serum albumin (BSA). After irradiation at increasing fluences from 1.0x10 15 to 2.5x10 16 ion/cm 2 , Fourier transform infrared spectra analysis was conducted. It was found that the secondary structures of BSA molecules were very sensitive to ion irradiation. Secondary conformations showed different trends of change during irradiation. With the increase of ion fluence from 0 to 2.5x10 16 ion/cm 2 , the fraction of α-helix and β-turns decreased from 17 to 12%, and from 40 to 31%, respectively, while that of random coil and β-sheet structure increased from 18 to 27%, and from 25 to 30%, respectively. Possible explanations for the secondary conformational changes of protein are proposed. (author)

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Energy Technology Data Exchange (ETDEWEB)

Mahoney, Christine M. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)]. E-mail: christine.mahoney@nist.gov; Fahey, Albert J. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Gillen, Greg [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Xu Chang [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Batteas, James D. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)

2006-07-30

Secondary ion mass spectrometry (SIMS) employing an SF{sub 5} {sup +} polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from -125 deg. C to 150 deg. C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced interfacial widths as compared to analysis at ambient temperature. Atomic force microscopy (AFM) images indicated that this improvement in interfacial width may be related to a decrease in sputter-induced topography. Depth profiling at higher temperatures was typically correlated with increased sputter rates. However, the improvements in interfacial widths and overall secondary ion stability were not as prevalent as was observed at low temperature. For PLA, improvements in signal intensities were observed at low temperatures, yet there was no significant change in secondary ion stability, interface widths or sputter rates. High temperatures yielded a significant decrease in secondary ion stability of the resulting profiles. PS films showed rapid degradation of characteristic secondary ion signals under all temperatures examined.

Secondary ion formation during electronic and nuclear sputtering of germanium

Science.gov (United States)

Breuer, L.; Ernst, P.; Herder, M.; Meinerzhagen, F.; Bender, M.; Severin, D.; Wucher, A.

2018-06-01

Using a time-of-flight mass spectrometer attached to the UNILAC beamline located at the GSI Helmholtz Centre for Heavy Ion Research, we investigate the formation of secondary ions sputtered from a germanium surface under irradiation by swift heavy ions (SHI) such as 5 MeV/u Au by simultaneously recording the mass spectra of the ejected secondary ions and their neutral counterparts. In these experiments, the sputtered neutral material is post-ionized via single photon absorption from a pulsed, intensive VUV laser. After post-ionization, the instrument cannot distinguish between secondary ions and post-ionized neutrals, so that both signals can be directly compared in order to investigate the ionization probability of different sputtered species. In order to facilitate an in-situ comparison with typical nuclear sputtering conditions, the system is also equipped with a conventional rare gas ion source delivering a 5 keV argon ion beam. For a dynamically sputter cleaned surface, it is found that the ionization probability of Ge atoms and Gen clusters ejected under electronic sputtering conditions is by more than an order of magnitude higher than that measured for keV sputtered particles. In addition, the mass spectra obtained under SHI irradiation show prominent signals of GenOm clusters, which are predominantly detected as positive or negative secondary ions. From the m-distribution for a given Ge nuclearity n, one can deduce that the sputtered material must originate from a germanium oxide matrix with approximate GeO stoichiometry, probably due to residual native oxide patches even at the dynamically cleaned surface. The results clearly demonstrate a fundamental difference between the ejection and ionization mechanisms in both cases, which is interpreted in terms of corresponding model calculations.

Suppression secondary electrons from target surface under pulsed ion beams bombardment

International Nuclear Information System (INIS)

Yang Zhen; Peng Yufei; Long Jidong; Lan Chaohui; Dong Pan; Shi Jinshui

2012-01-01

The producing mechanism of secondary electrons from target surface under ion beams bombardment is discussed. Several methods to suppress the secondary electrons in special vacuum devices and their advantages and disadvantages are introduced. The ways of using self-bias and curved surface target are proposed and verified in the experiment. The results show that the secondary electrons can be effectively suppressed when the self-bias is larger than 80 V. The secondary electron yield decreases by using curved surface target instead of flat target. The secondary electron yield calculated from the experimental data is about 0.67, which is slightly larger than the value (0.58) from the literature due to the impurities of the ion beam and target surface. The effect of suppressing the electron countercurrent by the self-bias method is analyzed. The result shows that the self-bias method can not only suppress the secondary electrons from target surface under ion beams bombardment, but also suppress the electron countercurrent resulting from the instability of the pulsed power source. (authors)

Efficient isotope ratio analysis of uranium particles in swipe samples by total-reflection x-ray fluorescence spectrometry and secondary ion mass spectrometry

International Nuclear Information System (INIS)

Esaka, Fumitaka; Watanabe, Kazuo; Fukuyama, Hiroyasu; Onodera, Takashi; Esaka, Konomi T.; Magara, Masaaki; Sakurai, Satoshi; Usuda, Shigekazu

2004-01-01

A new particle recovery method and a sensitive screening method were developed for subsequent isotope ratio analysis of uranium particles in safeguards swipe samples. The particles in the swipe sample were recovered onto a carrier by means of vacuum suction-impact collection method. When grease coating was applied to the carrier, the recovery efficiency was improved to 48±9%, which is superior to that of conventionally-used ultrasoneration method. Prior to isotope ratio analysis with secondary ion mass spectrometry (SIMS), total reflection X-ray fluorescence spectrometry (TXRF) was applied to screen the sample for the presence of uranium particles. By the use of Si carriers in TXRF analysis, the detection limit of 22 pg was achieved for uranium. By combining these methods with SIMS, the isotope ratios of 235 U/ 238 U for individual uranium particles were efficiently determined. (author)

Transport of secondary electrons and reactive species in ion tracks

Science.gov (United States)

Surdutovich, Eugene; Solov'yov, Andrey V.

2015-08-01

The transport of reactive species brought about by ions traversing tissue-like medium is analysed analytically. Secondary electrons ejected by ions are capable of ionizing other molecules; the transport of these generations of electrons is studied using the random walk approximation until these electrons remain ballistic. Then, the distribution of solvated electrons produced as a result of interaction of low-energy electrons with water molecules is obtained. The radial distribution of energy loss by ions and secondary electrons to the medium yields the initial radial dose distribution, which can be used as initial conditions for the predicted shock waves. The formation, diffusion, and chemical evolution of hydroxyl radicals in liquid water are studied as well. COST Action Nano-IBCT: Nano-scale Processes Behind Ion-Beam Cancer Therapy.

Simultaneous study of sputtering and secondary ion emission of binary Fe-based alloys

International Nuclear Information System (INIS)

Riadel, M.M.; Nenadovic, T.; Perovic, B.

1976-01-01

The sputtering and secondary ion emission of binary Fe-based alloys of simple phase diagrams have been studied simultaneously. A series FeNi and FeCr alloys in the concentration range of 0-100% have been bombarded by 4 keV Kr + ions in a secondary ion mass spectrometer. The composition of the secondary ions has been analysed and also a fraction of the sputtered material has been collected and analysed by electron microprobe. The surface topography of the etched samples has been studied by scanning electron microscope. The relative sputtering coefficients of the metals have been determined, and the preferential sputtering of the alloying component of lower S have been proved. The etching pictures of samples are in correlation with the sputtering rates. Also the degree of secondary ionization has been calculated from the simultaneously measured ion emission and sputtering data. α + shows the change in the concentration range of the melting point minimum. This fact emphasizes the connection between the physico-chemical properties of alloys and their secondary emission process. From the dependence of the emitted homo- and hetero-cluster ions, conclusions could be shown concerning the production mechanism of small metallic aggregates

Non-invasive monitoring of therapeutic carbon ion beams in a homogeneous phantom by tracking of secondary ions

Science.gov (United States)

Gwosch, K.; Hartmann, B.; Jakubek, J.; Granja, C.; Soukup, P.; Jäkel, O.; Martišíková, M.

2013-06-01

Radiotherapy with narrow scanned carbon ion beams enables a highly accurate treatment of tumours while sparing the surrounding healthy tissue. Changes in the patient’s geometry can alter the actual ion range in tissue and result in unfavourable changes in the dose distribution. Consequently, it is desired to verify the actual beam delivery within the patient. Real-time and non-invasive measurement methods are preferable. Currently, the only technically feasible method to monitor the delivered dose distribution within the patient is based on tissue activation measurements by means of positron emission tomography (PET). An alternative monitoring method based on tracking of prompt secondary ions leaving a patient irradiated with carbon ion beams has been previously suggested. It is expected to help in overcoming the limitations of the PET-based technique like physiological washout of the beam induced activity, low signal and to allow for real-time measurements. In this paper, measurements of secondary charged particle tracks around a head-sized homogeneous PMMA phantom irradiated with pencil-like carbon ion beams are presented. The investigated energies and beam widths are within the therapeutically used range. The aim of the study is to deduce properties of the primary beam from the distribution of the secondary charged particles. Experiments were performed at the Heidelberg Ion Beam Therapy Center, Germany. The directions of secondary charged particles emerging from the PMMA phantom were measured using an arrangement of two parallel pixelated silicon detectors (Timepix). The distribution of the registered particle tracks was analysed to deduce its dependence on clinically important beam parameters: beam range, width and position. Distinct dependencies of the secondary particle tracks on the properties of the primary carbon ion beam were observed. In the particular experimental set-up used, beam range differences of 1.3 mm were detectable. In addition, variations

Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

Science.gov (United States)

Bogdanović Radović, Iva; Siketić, Zdravko; Jembrih-Simbürger, Dubravka; Marković, Nikola; Anghelone, Marta; Stoytschew, Valentin; Jakšić, Milko

2017-09-01

Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.

Visualization of hydrogen in steels by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Takai, Kenichi

2000-01-01

Secondary ion mass spectrometry (SIMS) enables us to visualize hydrogen trapping sites in steels. Information about the hydrogen trapping sites in high-strength steels by SIMS is very important to discuss environmental embrittlement mechanism for developing steels with a high resistance to the environmental embrittlement. Secondary ion image analysis by SIMS has made possible to visualize the hydrogen and deuterium trapping sites in the steels. Hydrogen in tempered martensite steels containing Ca tends to accumulate on inclusions, at grain boundaries, and in segregation bands. Visualization of hydrogen desorption process by secondary ion image analysis confirms that the bonding between the inclusions and the hydrogen is strong. Cold-drawn pearlite steels trap hydrogen along cold-drawing direction. Pearlite phase absorbs the hydrogen more than ferrite phase does. This article introduces the principle of SIMS, its feature, analysis method, and results of hydrogen visualization in steels. (author)

Innovation and its Management as Observed in the Lithium Ion Secondary Battery Business

OpenAIRE

正本, 順三

2008-01-01

At present, mobile phones and laptop computers are essential items in our daily life. As a battery for such portable devices, the lithium ion secondary battery is used. The lithium ion secondary battery, which is used as a battery for such portable devices, was first invented by Dr. Yoshino at Asahi Kasei, where the present author formerly worked. In this paper, the author describes how the lithium ion secondary battery was developed by the inventor, how the technology originated in Japan and...

Mass spectrometric study of the negative and positive secondary ions emitted from ethanol microdroplets by MeV-energy heavy ion impact

Science.gov (United States)

Kitajima, Kensei; Majima, Takuya; Nishio, Tatsuya; Oonishi, Yoshiki; Mizutani, Shiori; Kohno, Jun-ya; Saito, Manabu; Tsuchida, Hidetsugu

2018-06-01

We have investigated the negative and positive secondary ions emitted from ethanol droplets by 4.0-MeV C3+ impact to reveal the characteristic features of the reaction processes induced by fast heavy ions at the liquid ethanol surface. Analysis of the secondary ions was performed by time-of-flight mass spectrometry for microdroplet targets in a high vacuum environment. Fragment ions, deprotonated cluster ions, and trace amounts of the reaction product ions are observed in the negative secondary ions. The main fragment anions are C2HmO- (m = 1, 3, and 5) and C2H- generated by loss of hydrogen and oxygen atoms. The reaction product anions include deprotonated glycols, larger alcohols, and their dehydrated and dehydrogenated forms generated by secondary reactions between fragments and radicals. Furthermore, C3Hm- (m = 0-2) and C4Hm- (m = 0 and 1) are observed, which could be produced through a plasma state generated in the heavy ion track. Deprotonated ethanol cluster ions, [(EtOH)n - H]-, are observed up to about n = 25. [(EtOH)n - H]- have smaller kinetic energies than the protonated cluster ions (EtOH)nH+. This probably represents the effect of the positive Coulomb potential transiently formed in the ion track. We also discuss the size distributions and structures of the water- and CH2OH-radical-attached ethanol cluster ions.

Simulation study of secondary electron images in scanning ion microscopy

CERN Document Server

Ohya, K

2003-01-01

The target atomic number, Z sub 2 , dependence of secondary electron yield is simulated by applying a Monte Carlo code for 17 species of metals bombarded by Ga ions and electrons in order to study the contrast difference between scanning ion microscopes (SIM) and scanning electron microscopes (SEM). In addition to the remarkable reversal of the Z sub 2 dependence between the Ga ion and electron bombardment, a fine structure, which is correlated to the density of the conduction band electrons in the metal, is calculated for both. The brightness changes of the secondary electron images in SIM and SEM are simulated using Au and Al surfaces adjacent to each other. The results indicate that the image contrast in SIM is much more sensitive to the material species and is clearer than that for SEM. The origin of the difference between SIM and SEM comes from the difference in the lateral distribution of secondary electrons excited within the escape depth.

Effect of energy selection on quantitative analysis in secondary ion microanalysis

International Nuclear Information System (INIS)

Steele, I.M.; Solberg, T.N.; Smith, J.V.; Clayton, R.N.; Hutcheon, I.D.

1977-01-01

Systematic change of voltage on the components of the secondary ion (SI) extraction system of our AEI-IM20 ion microprobe produced major changes of relative intensities of secondary ions passing through the mass spectrometer. The repeller, which bends the SI beam through about 60 0 , has the greatest effect, and can be used to plot the energy distribution. The extractor and the deflecting and focusing components have smaller but significant effects. Because low-energy secondary ions have a near-symmetrical distribution, whereas high-energy ones have an assymetric distribution favoring high energies, tuning of the acceptance band to higher energy reduces interference from low-energy ions, which tend to be unwanted molecular ions, at the expense of reduced transmission. Tuning to lower energy increases interference but gives higher transmission. The former condition is desirable for instruments restricted to low mass resolution, whereas both conditions are valuable for instruments adjustable for both high and low mass resolution. Other important factors are (a) sensitivity to surface irregularities which perturb SI energy collection, and (b) change in derived 'temperatures' from thermodynamic sputtering models merely from tuning the energy acceptance band. Careful attention to the above factors yielded reproducible SI ratios for the binary series of plagioclase feldspars. (Auth.)

Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)

Science.gov (United States)

Hervig, R. L.; Chen, J.; Schauer, S.; Stanley, B. D.; Moore, G. M.; Roggensack, K.

2012-12-01

In secondary ion mass spectrometry (SIMS), a sample is bombarded by a charged particle beam (the primary ion) and sputtered positive or negative secondary ions are analyzed in a mass spectrometer. When the target is not conducting (like many geological materials), sample charging can result in variable deflection of secondary ions away from the mass spectrometer and a low, unstable, or absent signal. Applying a thin conducting coat (e.g., C, Au) to polished samples is required, and if the primary ion beam is negatively-charged, the build-up of negative charge can be alleviated by secondary electrons draining to the conducting coat at the edge of the crater (if a positive potential is applied to the sample for the collection of positive secondary ions) or accelerated away from the crater (if a negative potential is applied for negative ion study). Unless the sputtered crater in the conducting coat becomes too large, sample charging can be kept at a controllable level, and high-quality trace element analyses and isotope ratios have been obtained using this technique over the past 3+ decades. When a positive primary beam is used, the resulting build-up of positive charge in the sample requires an electron gun to deliver sufficient negative charge to the sputtered crater. While there are many examples of successful analyses using this approach, the purpose of this presentation is to describe a very simple technique for aligning the electron gun on Cameca nf and 1270/80 SIMS instruments. This method allows reproducible analyses of insulating phases with a Cs+ primary beam and detection of negative secondary ions. Normally, the filament voltage on the E-gun is the same as the sample voltage; thus electrons do not strike the sample except when a positive charge has built up (e.g., in the analysis crater!). In this method, we decrease the sample voltage by 3 or more kV, so that the impact energy of the electrons is sufficient to induce a cathodoluminescent (CL) image on an

Negative secondary ion emission from oxidized surfaces

International Nuclear Information System (INIS)

Gnaser, H.; Kernforschungsanlage Juelich G.m.b.H.

1984-01-01

The emission of negative secondary ions from 23 elements was studied for 10 keV O 2 + and 10 keV In + impact at an angle of incidence of 45 0 . Partial oxidation of the sample surfaces was achieved by oxygen bombardment and/or by working at a high oxygen partial pressure. It was found that the emission of oxide ions shows an element-characteristic pattern. For the majority of the elements investigated these features are largely invariant against changes of the surface concentration of oxygen. For the others admission of oxygen strongly changes the relative intensities of oxide ions: a strong increase of MO 3 - signals (M stands for the respective element) is accompanied by a decrease of MO - and M - intensities. Different primary species frequently induce changes of both the relative and the absolute negative ion intensities. Carbon - in contrast to all other elements - does not show any detectable oxide ion emission but rather intense cluster ions Csub(n) - (detected up to n=12) whose intensities oscillate in dependence on n. (orig./RK)

Investigations on Cu-Ni and Cu-Al systems with secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Rodriguez-Murcia, H.; Beske, H.E.

1976-04-01

The ratio of the ionization coefficients of secondary atomic ions emitted from the two component systems Cu-Ni and Cu-Al was investigated as a function of the concentration of the two components. In the low concentration range the ratio of the ionization coefficients is a constant. An influence of the phase composition on the ratio of the ionization coefficients was found in the Cu-Al system. In addition, the cluster ion emission was investigated as a function of the concentration and the phase composition of the samples. The secondary atomic ion intensity was influenced by the presence of cluster ions. The importance of the cluster ions in quantitative analysis and phase determination by means of secondary ion mass spectrometry are discussed. (orig.) [de

An investigation of the mass spectra of secondary ions ejected from the single crystal surface of semiconductors

International Nuclear Information System (INIS)

Koval', A.G.; Mel'nikov, V.N.; Enukov, Yu.V.

1976-01-01

The mass spectra of secondary positive and negative ions, ejected by an Ar + ion beam from the (100) face of an epitaxial film of the semiconductor Alsub(x)Gasub(1-x)As were investigated. There are many various secondary ions in the mass spectrum under investigation. They may be divided into four groups according to their origins. Mass spectra of secondary positive and negative secondary ions differ much, either in their composition or the intensities of homogeneous ions. The I(T) dependences (I=the current of corresponding secondary ions, T=target temperature) were obtained for secondary and negative ions taken from groups differing by their origin. The I(T) dependences were obtained at several oxygen pressures in a chamber. For the ions with 'superficial' origin a strong dependence of their current on target temperature is observed. Oxygen pressure increase leads to substantial change of the I(T)curves. (Auth.)

Depth resolution of secondary ion mass spectrometry

International Nuclear Information System (INIS)

Pustovit, A.N.

2004-01-01

The effect of the solid body discreteness in the direction of the normal to the sample surface on the depth resolution of the secondary ion mass spectrometry method is analyzed. It is shown that for this case the dependence of the width at the semi-height of the delta profiles of the studied elements depth distribution on the energy and angle of incidence of the initial ions should have the form of the stepwise function. This is experimentally proved by the silicon-germanium delta-layers in the silicon samples [ru

Paradoxes of photoconductive target and optical control of secondary ion yield

International Nuclear Information System (INIS)

Rokakh, A. G.; Matasov, M. D.

2010-01-01

This study of the photoconductivity of semiconductors, in particular, cadmium chalcogenides as materials for targets of vacuum image converters followed the path of overcoming paradoxes. The concepts developed by the classics of photoelectricity also help to understand the paradoxes of the new secondary-ion photoelectric effect, especially, its spectral characteristic. The optical channel of secondary ion yield control via a photoconductive target opens the way to a new branch of nanotechnology, i.e., optoionics.

Secondary Ion Mass Spectrometry SIMS XI

Science.gov (United States)

Gillen, G.; Lareau, R.; Bennett, J.; Stevie, F.

2003-05-01

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories: Isotopic SIMS Biological SIMS Semiconductor Characterization Techniques and Applications Ultra Shallow Depth Profiling Depth Profiling Fundamental/Modelling and Diffusion Sputter-Induced Topography Fundamentals of Molecular Desorption Organic Materials Practical TOF-SIMS Polyatomic Primary Ions Materials/Surface Analysis Postionization Instrumentation Geological SIMS Imaging Fundamentals of Sputtering Ion Formation and Cluster Formation Quantitative Analysis Environmental/Particle Characterization Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Aspects of quantitative secondary ion mass spectrometry

International Nuclear Information System (INIS)

Grauer, R.

1982-05-01

Parameters which have an influence on the formation of secondary ions by ion bombardment of a solid matrix are discussed. Quantitative SIMS-analysis with the help of calibration standards necessitates a stringent control of these parameters. This is particularly valid for the oxygen partial pressure which for metal analysis has to be maintained constant also under ultra high vacuum. The performance of the theoretical LTE-model (Local Thermal Equilibrium) using internal standards will be compared with the analysis with the help of external standards. The LTE-model does not satisfy the requirements for quantitative analysis. (Auth.)

Dependence of secondary ion emission current on the composition of beryllium-nickel alloys

International Nuclear Information System (INIS)

Pistryak, V.M.; Kozlov, V.F.; Tikhinskij, G.F.; Fogel', Ya.M.

1976-01-01

The dependence is studied of the secondary ions emission current on the composition of beryllium-nickel alloys. It is established that appearance of intermetallide phases in the Be-Ni alloys has no effect on the linear character of the secondary ions Ni + and Be + of emission current. The phase transformation from the solid solution to the compound Ni 5 Be 21 with a change in the alloys concentration is fixed by appearance of the secondary ion NiBe + emission. The limited solubility of nickel in solid beryllium at a temperature close to room temperature is determined to be equal to 1.3+-0.27 at%

Quantization of secondary ion mass spectrometry (SIMS) data using external and internal standards

International Nuclear Information System (INIS)

Gnaser, H.

1983-01-01

Some aspects of multi-dimensional characterization of solids by secondary ion mass spectrometry (SIMS) are given. A theoretical part discusses methods for the quantization of SIMS data and the most prominent effects of ion-solid interactions as related to SIMS. After a description of the instrument used for experiments (a quadrupole-equipped ion microprobe featuring a liquid metal ion source in addition to the standard duoplasmatron gas ion source) the first experimental section is devoted to the determination of practical sensitivities and relative sensitivity factors for selected pure elements, binary and treary alloys and multicomponent systems. For 23 pure elements practical sensitivities under O + 2 bombardment also have been compared to those under In + -bombardment; it was shown that on oxygen saturated surfaces yields under In + -bombardment are higher, this making feasible use of submicron In-beams for surface analysis. In the second experimental section boron implants in silicon have been used for studying depth profiling capabilities of the instrument. Sputtering yields of Si and degrees of ionization of both B and Si have been measured. It has been shown that implantation profiles may deviate considerably from Gaussian but can be described by means of mathematical distribution functions. In the third experimental section depth resolution of the erosion process has been studied by profiling a Ni/Cr multilayer sample (100 A single layer) and been found to be approximately constant over the depth range investigated. Quantization of depth profiles, usually distorted by matrix effects, has been attempted using the primary beam species (In) as internal implantation standard. Some problems in connection with the conversion of secondary ion micrographs to concentration maps are discussed. Elemental detection limits in multidimensional SIMS analysis are given in dependence of primary beam size and total eroded depth. (Author)

Secondary ions produced from condensed rare gas targets under highly charged MeV/amu heavy ion bombardment

International Nuclear Information System (INIS)

Tawara, H.; Tonuma, T.; Kumagai, H.; Matsuo, T.

1994-01-01

Secondary ions produced from condensed rare gas targets are observed under MeV/amu, highly charged, heavy ion impact. The intensities of the observed cluster ions decrease smoothly as the cluster sizes become large but show some discontinuities at particular sizes of cluster ions. This seems to be closely related to the stabilities of cluster ion structures. It is also noted that very few doubly charged or practically no triply/higher charged ions have been observed, in sharp contrast to that of some condensed molecular targets. (orig.)

The effect of work function changes on secondary ion energy spectra

International Nuclear Information System (INIS)

Wittmaack, K.

1983-01-01

The effect of work function changes on experimental secondary ion energy spectra is discussed. In agreement with theory the measured ion intensities frequently exhibit an exponential work function dependence. However, the predicted velocity dependence is only observed at fairly high secondary ion energies. In the absence of a velocity dependence of the degree of ionization measured shifts of energy spectra reflect work function changes directly. Various instrumental problems are shown to aggravate a detailed comparison between experiment and theory. Significant artefacts must be expected if the extraction field is of the order of or less than the lateral field induced by a work function difference between the bombarded spot and the surrounding sample surface. (Auth.)

Ion-impact secondary emission in negative corona with photoionization

Directory of Open Access Journals (Sweden)

B. X. Lu

2017-03-01

Full Text Available A corona discharge measurement system and simulation model are presented to investigate the effects of photoionization and ion-impact secondary emission process in negative corona discharge. The simulation results obtained is shown good agreement with experimental observations. Distribution of electron density along the symmetry axis at three critical moments is shown and the role of photoionization in negative corona discharge is clearly explained. Moreover, the current pulses are also presented under different secondary emission coefficients and the effect of the secondary emission coefficient is discussed.

Proposal for secondary ion beams and update of data taking schedule for 2009-2013

CERN Document Server

Abgrall, N; Andrieu, B; Anticic, T; Antoniou, N; Argyriades, J; Asryan, A G; Baatar, B; Blondel, A; Blumer, J; Boldizsar, L; Bravar, A; Brzychczyk, J; Bunyatov, S A; Choi, K U; Christakoglou, P; Chung, P; Cleymans, J; Derkach, D A; Diakonos, F; Dominik, W; Dumarchez, J; Engel, R; Ereditato, A; Feofilov, G A; Ferrero, A; Fodor, Z; Gazdzicki, M; Golubeva, M; Grebieszkow, K; Guber, F; Hasegawa, T; Haungs, A; Hess, M; Igolkin, S; Ivanov, A S; Ivashkin, A; Kadija, K; Katrynska, N; Kielczewska, D; Kikola, D; Kim, J H; Kobayashi, T; Kolesnikov, V I; Kolev, D; Kolevatov, R S; Kondratiev, V P; Kurepin, A; Lacey, R; Laszlo, A; Lehmann, S; Lungwitz, B; Lyubushkin, V V; Maevskaya, A; Majka, Z; Malakhov, A I; Marchionni, A; Marcinek, A; Maris, I; Matveev, V; Melkumov, G L; Meregaglia, A; Messina, M; Meurer, C; Mijakowski, P; Mitrovski, M; Montaruli, T; Mrówczynski, St; Murphy, S; Nakadaira, T; Naumenko, P A; Nikolic, V; Nishikawa, K; Palczewski, T; Pálla, G; Panagiotou, A D; Peryt, W; Petridis, A; Planeta, R; Pluta, J; Popov, B A; Posiadala, M; Przewlocki, P; Rauch, W; Ravonel, M; Renfordt, R; Röhrich, D; Rondio, E; Rossi, B; Roth, M; Rubbia, A; Rybczynski, M; Sadovskii, A; Sakashita, K; Schuster, T; Sekiguchi, T; Seyboth, P; Shileev, K; Sissakian, A N; Skrzypczak, E; Slodkowski, M; Sorin, A S; Staszel, P; Stefanek, G; Stepaniak, J; Strabel, C; Ströbele, H; Susa, T; Szentpétery, I; Szuba, M; Taranenko, A; Tsenov, R; Ulrich, R; Unger, M; Vassiliou, M; Vechernin, V V; Vesztergombi, G; Wlodarczyk, Z; Wojtaszek, A; Yi, J G; Yoo, I K; CERN. Geneva. SPS and PS Experiments Committee; SPSC

2009-01-01

This document presents the proposal for secondary ion beams and the updated data taking schedule of the NA61 Collaboration. The modification of the original NA61 plans is necessary in order to reach compatibility between the current I-LHC and NA61 schedules. It assumes delivery of primary proton beam in 2009-2012 and of primary lead beam in 2011-2013. The primary lead beam will be fragmented into a secondary beam of lighter ions. The modified H2 beam line will serve as a fragment separator to produce the light ion species for NA61 data taking. The expected physics performance of the NA61 experiment with secondary ion beams will be sufficient to reach the primary NA61 physics goals.

Monte Carlo modeling of ion beam induced secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Huh, U., E-mail: uhuh@vols.utk.edu [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Cho, W. [Electrical and Computer Engineering, University of Tennessee, Knoxville, TN 37996-2100 (United States); Joy, D.C. [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)

2016-09-15

Ion induced secondary electrons (iSE) can produce high-resolution images ranging from a few eV to 100 keV over a wide range of materials. The interpretation of such images requires knowledge of the secondary electron yields (iSE δ) for each of the elements and materials present and as a function of the incident beam energy. Experimental data for helium ions are currently limited to 40 elements and six compounds while other ions are not well represented. To overcome this limitation, we propose a simple procedure based on the comprehensive work of Berger et al. Here we show that between the energy range of 10–100 keV the Berger et al. data for elements and compounds can be accurately represented by a single universal curve. The agreement between the limited experimental data that is available and the predictive model is good, and has been found to provide reliable yield data for a wide range of elements and compounds. - Highlights: • The Universal ASTAR Yield Curve was derived from data recently published by NIST. • IONiSE incorporated with the Curve will predict iSE yield for elements and compounds. • This approach can also handle other ion beams by changing basic scattering profile.

Secondary ion emission from ultra-thin oxide layers bombarded by energetic (MeV) heavy ions: depth of origin and layer homogeneity

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.; Cabaud, B.; Fuchs, G.; Hoareau, A.; Treilleux, M.; Danel, J.S.

1993-09-01

The escape depth of the secondary ions resulting from electronic sputtering of fast heavy ions in inorganic thin films has been investigated. Chromium layers deposited onto SiO 2 substrate as well as SiO x layers deposited onto chromium substrate have been characterized by secondary ion emission mass spectrometry (SIMS) in combination with time-of-flight (TOF) mass analysis (also referred as HSF-SIMS). These crossed experiments lead to a value around 1 nm for SiO x layers and 0.5 nm for Cr layers. On the other hand, HSF-SIMS can be used to correlate the intensity of the secondary ion emission to the film coverage rate and (or) the morphology of particular films like those produced by Low Energy Cluster Beam Deposition (LECBD). Using Sb deposits, the non-linear relationship between ion emission and coverage is interpreted in terms of sputtering enhancement in the individual supported clusters. (author) 22 refs., 9 figs., 1 tab

Visualization of metallodrugs in single cells by secondary ion mass spectrometry imaging.

Science.gov (United States)

Wu, Kui; Jia, Feifei; Zheng, Wei; Luo, Qun; Zhao, Yao; Wang, Fuyi

2017-07-01

Secondary ion mass spectrometry, including nanoscale secondary ion mass spectrometry (NanoSIMS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS), has emerged as a powerful tool for biological imaging, especially for single cell imaging. SIMS imaging can provide information on subcellular distribution of endogenous and exogenous chemicals, including metallodrugs, from membrane through to cytoplasm and nucleus without labeling, and with high spatial resolution and chemical specificity. In this mini-review, we summarize recent progress in the field of SIMS imaging, particularly in the characterization of the subcellular distribution of metallodrugs. We anticipate that the SIMS imaging method will be widely applied to visualize subcellular distributions of drugs and drug candidates in single cells, exerting significant influence on early drug evaluation and metabolism in medicinal and pharmaceutical chemistry. Recent progress of SIMS applications in characterizing the subcellular distributions of metallodrugs was summarized.

Development of methodics for the characterization of the composition of the ion-collision-induced secondary-particle flux by comparison of the yield contributions of photoinduced ion formation processes

International Nuclear Information System (INIS)

Vering, Guido

2008-01-01

The aim of this work was to develop a method to distinguish between different ion formation processes and to determine the influence of these processes on the total number of detected monatomic ions of a certain element. A vector/matrix-formalism was developed, which describes the physical processes of sputtering, ion formation, mass separation and detection in laser-SNMS. In the framework of the method developed, based on this theoretic formalism, changes in the secondary flux contribution of the respective element were observed by comparing the detected monatomic ion yield obtained in specifically aligned (SIMS and) laser-SNMS experiments. The yields resulting from these experiments were used to calculate characteristic numbers to compare the flux composition from different surfaces. The potential of the method was demonstrated for the elements boron, iron and gadolinium by investigating the changes in the flux composition of secondary particles sputtered from metallic surfaces, as a function of the oxygen concentration at the surface. Finally, combined laser-SNMS depth profiles and images, obtained with both laser systems, were presented to demonstrate how the parallel detection of the three differently originated ion signals of the same element can be used to get additional information about the composition of the flux of secondary particles synchronously during the analysis of elemental distributions. In this respect the presented method can be a very helpful tool to prevent misleading interpretations of SIMS or laser-SNMS data. (orig.)

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Science.gov (United States)

Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

2018-02-01

A procedure has been established to define the interface position in depth profiles accurately when using secondary ion mass spectrometry and the negative secondary ions. The interface position varies strongly with the extent of the matrix effect and so depends on the secondary ion measured. Intensity profiles have been measured at both fluorenylmethyloxycarbonyl-uc(l)-pentafluorophenylalanine (FMOC) to Irganox 1010 and Irganox 1010 to FMOC interfaces for many secondary ions. These profiles show separations of the two interfaces that vary over some 10 nm depending on the secondary ion selected. The shapes of these profiles are strongly governed by matrix effects, slightly weakened by a long wavelength roughening. The matrix effects are separately measured using homogeneous, known mixtures of these two materials. Removal of the matrix and roughening effects give consistent compositional profiles for all ions that are described by an integrated exponentially modified Gaussian (EMG) profile. Use of a simple integrated Gaussian may lead to significant errors. The average interface positions in the compositional profiles are determined to standard uncertainties of 0.19 and 0.14 nm, respectively, using the integrated EMG function. Alternatively, and more simply, it is shown that interface positions and profiles may be deduced from data for several secondary ions with measured matrix factors by simply extrapolating the result to Ξ = 0. Care must be taken in quoting interface resolutions since those measured for predominantly Gaussian interfaces with Ξ above or below zero, without correction, appear significantly better than the true resolution.

Alpha spectrometry and secondary ion mass spectrometry of thorium

International Nuclear Information System (INIS)

Strisovska, Jana; Kuruc, Jozef; Galanda, Dusan; Matel, Lubomir; Velic, Dusan; Aranyosiova, Monika

2009-01-01

A sample of thorium content on steel discs was prepared by electrodeposition with a view to determining the natural thorium isotope. Thorium was determined by alpha spectrometry and by secondary ion mass spectrometry and the results of the two methods were compared

Surface potential measurement of negative-ion-implanted insulators by analysing secondary electron energy distribution

International Nuclear Information System (INIS)

Toyota, Yoshitaka; Tsuji, Hiroshi; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki.

1994-01-01

The negative ion implantation method we have proposed is a noble technique which can reduce surface charging of isolated electrodes by a large margin. In this paper, the way to specify the surface potential of negative-ion-implanted insulators by the secondary electron energy analysis is described. The secondary electron energy distribution is obtained by a retarding field type energy analyzer. The result shows that the surface potential of fused quartz by negative-ion implantation (C - with the energy of 10 keV to 40 keV) is negatively charged by only several volts. This surface potential is extremely low compared with that by positive-ion implantation. Therefore, the negative-ion implantation is a very effective method for charge-up free implantation without charge compensation. (author)

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

Science.gov (United States)

Martišíková, Mária; Jakubek, Jan; Granja, Carlos; Hartmann, Bernadette; Opálka, Lukáš; Pospíšil, Stanislav; Jäkel, Oliver

2011-11-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient`s condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2-30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

International Nuclear Information System (INIS)

Martišíková, Mária; Hartmann, Bernadette; Jäkel, Oliver; Jakubek, Jan; Granja, Carlos; Opálka, Lukáš; Pospíšil, Stanislav

2011-01-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient's condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2–30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

Energy Technology Data Exchange (ETDEWEB)

Aimoto, K. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)]. E-mail: dm053502@cc.seikei.ac.jp; Aoyagi, S. [Department of Regional Development, Faculty of Life and Environmental Science, Shimane University, 1060 Nishikawatsu-cho, Matsue-shi, Shimane 690-8504 (Japan); Kato, N. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan); Iida, N. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Yamamoto, A. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Kudo, M. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)

2006-07-30

We investigated the enhancement of the secondary ion intensity in the TOF-SIMS spectra obtained by Au{sup +} and Au{sub 3} {sup +} bombardment in comparison with Ga{sup +} excitation using polymer samples with different molecular weight distributions. Since the polymer samples used in this experiment have a wide molecular weight distribution, the advantages of the gold cluster primary ion source over monoatomic ion could accurately be evaluated. It was observed that the degree of fragmentation decreased by the usage of cluster primary ion beam compared with monoatomic ion beam, which was observed as a shift of the intensity distribution in the spectra. It was also found out that the mass effect of Au{sup +} and Ga{sup +} as monoatomic primary ion, resulted in about 10-60 times of enhancement for both samples with different molecular distributions. On the other hand, the Au{sub 3} {sup +} bombardment caused intensity enhancement about 100-2600 compared with Ga{sup +} bombardment, depending on the mass range of the detected secondary ion species. The cluster primary ion effect of Au{sub 3} {sup +}, compared with Au{sup +}, therefore, was estimated to be about 10-45.

Storage of a lithium-ion secondary battery under micro-gravity conditions

Science.gov (United States)

Sone, Yoshitsugu; Ooto, Hiroki; Yamamoto, Masahiro; Eguro, Takashi; Sakai, Shigeru; Yoshida, Teiji; Takahashi, Keiji; Uno, Masatoshi; Hirose, Kazuyuki; Tajima, Michio; Kawaguchi, Jun'ichiro

'HAYABUSA' is a Japanese inter-planetary spacecraft built for the exploration of an asteroid named 'ITOKAWA.' The spacecraft is powered by a 13.2 Ah lithium-ion secondary battery. To realize maximum performance of the battery for long flight operation, the state-of-charge (SOC) of the battery was maintained at ca. 65% during storage, in case it is required for a loss of attitude control. The capacity of the battery was measured during flight operations. Along with the operation in orbit, a ground-test battery was discharged, and both results showed a good agreement. This result confirmed that the performance of the lithium-ion secondary battery stored under micro-gravity conditions is predictable using a ground-test battery.

Surface characterization by energy distribution measurements of secondary electrons and of ion-induced electrons

International Nuclear Information System (INIS)

Bauer, H.E.; Seiler, H.

1988-01-01

Instruments for surface microanalysis (e.g. scanning electron or ion microprobes, emission electron or ion microscopes) use the current of emitted secondary electrons or of emitted ion-induced electrons for imaging of the analysed surface. These currents, integrating over all energies of the emitted low energy electrons, are however, not well suited to surface analytical purposes. On the contrary, the energy distribution of these electrons is extremely surface-sensitive with respect to shape, size, width, most probable energy, and cut-off energy. The energy distribution measurements were performed with a cylindrical mirror analyser and converted into N(E), if necessary. Presented are energy spectra of electrons released by electrons and argon ions of some contaminated and sputter cleaned metals, the change of the secondary electron energy distribution from oxidized aluminium to clean aluminium, and the change of the cut-off energy due to work function change of oxidized aluminium, and of a silver layer on a platinum sample. The energy distribution of the secondary electrons often shows detailed structures, probably due to low-energy Auger electrons, and is broader than the energy distribution of ion-induced electrons of the same object point. (author)

Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

Energy Technology Data Exchange (ETDEWEB)

Thongkumkoon, P. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand); Prakrajang, K. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Faculty of Science, Maejo University, Chiang Mai 50290 (Thailand); Thopan, P.; Yaopromsiri, C. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Suwannakachorn, D. [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand); Yu, L.D., E-mail: yuld@fnrf.science.cmu.ac.th [Plasma and Beam Physics Research Facility, Department of Physics and Materials Science, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand); Thailand Center of Excellence in Physics, Commission on Higher Education, 328 Si Ayutthaya Road, Bangkok 10400 (Thailand)

2013-07-15

Highlights: ► Detected X-ray emission from metal, plastic and biological samples. ► Characteristic X-ray emission was detected from metal but not from non-metals. ► Low-energy ion bombarded bacteria held in different sample holders. ► Bacteria held in metal holder had higher mutation rate than in plastic holder. ► Ion-beam-induced X-ray from biological sample is not a basic mutation source. -- Abstract: Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation.

Is low-energy-ion bombardment generated X-ray emission a secondary mutational source to ion-beam-induced genetic mutation?

International Nuclear Information System (INIS)

Thongkumkoon, P.; Prakrajang, K.; Thopan, P.; Yaopromsiri, C.; Suwannakachorn, D.; Yu, L.D.

2013-01-01

Highlights: ► Detected X-ray emission from metal, plastic and biological samples. ► Characteristic X-ray emission was detected from metal but not from non-metals. ► Low-energy ion bombarded bacteria held in different sample holders. ► Bacteria held in metal holder had higher mutation rate than in plastic holder. ► Ion-beam-induced X-ray from biological sample is not a basic mutation source. -- Abstract: Low-energy ion beam biotechnology has achieved tremendous successes in inducing crop mutation and gene transfer. However, mechanisms involved in the related processes are not yet well understood. In ion-beam-induced mutation, ion-bombardment-produced X-ray has been proposed to be one of the secondary mutation sources, but the speculation has not yet been experimentally tested. We carried out this investigation to test whether the low-energy ion-beam-produced X-ray was a source of ion-beam-induced mutation. In the investigation, X-ray emission from 29-keV nitrogen- or argon- ion beam bombarded bacterial Escherichia coli (E. coli) cells held in a metal or plastic sample holder was in situ detected using a highly sensitive X-ray detector. The ion beam bombarded bacterial cells held in different material holders were observed for mutation induction. The results led to a conclusion that secondary X-ray emitted from ion-beam-bombarded biological living materials themselves was not a, or at least a negligible, mutational source, but the ion-beam-induced X-ray emission from the metal that made the sample holder could be a source of mutation

Surface potential measurement of insulators in negative-ion implantation by secondary electron energy-peak shift

International Nuclear Information System (INIS)

Nagumo, Shoji; Toyota, Yoshitaka; Tsuji, Hiroshi; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1993-01-01

Negative-ion implantation is expected to realize charge-up free implantation. In this article, about a way to specify surface potential of negative-ion implanted insulator by secondary-electron-energy distribution, its principle and preliminary experimental results are described. By a measuring system with retarding field type energy analyzer, energy distribution of secondary electron from insulator of Fused Quartz in negative-carbon-ion implantation was measured. As a result the peak-shift of its energy distribution resulted according with the surface potential of insulator. It was found that surface potential of insulator is negatively charged by only several volts. Thus, negative-ion implanted insulator reduced its surface charge-up potential (without any electron supply). Therefore negative-ion implantation is considered to be much more effective method than conventional positive-ion implantation. (author)

Secondary emission of negative ions and electrons resulting from electronic sputtering of cesium salts

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.

1993-04-01

Secondary ion emission of negative ions and electrons from alkali salts bombarded with high energy (9 MeV) Ar +++ is discussed. Quite different features are observed according to the nature of the salt investigated (halide or oxygenated). In the case of cesium, the electron emission from halides is characterized by intense electron showers (several hundred electrons) with narrow distributions in intensity and orientation. Conversely, for oxygenated salts, these distributions are broader, much less intense (one order of magnitude), and the ion emission exhibits an dissymmetry, which has never been observed for inorganics. This last result is interpreted in terms of radiolysis of the oxygenated salt, a process well documented for gamma-ray irradiation, but not yet reported in secondary ion emission. (author) 17 refs.; 10 figs

Duopigatron ion source studies

International Nuclear Information System (INIS)

Bacon, F.M.; Bickes, R.W. Jr.; O'Hagan, J.B.

1978-07-01

Ion source performance characteristics consisting of total ion current, ion energy distribution, mass distribution, and ion current density distribution were measured for several models of a duopigatron. Variations on the duopigatron design involved plasma expansion cup material and dimensions, secondary cathode material, and interelectrode spacings. Of the designs tested, the one with a copper and molybdenum secondary cathode and a mild steel plasma expansion cup proved to give the best results. The ion current density distribution was peaked at the center of the plasma expansion cup and fell off to 80 percent of the peak value at the cup wall for a cup 15.2 mm deep. A total ion current of 180 mA consisting of 60 to 70 percent atomic ions was produced with an arc current of 20 A and source pressure of 9.3 Pa. More shallow cups produced a larger beam current and a more sharply peaked ion current density distribution. Typical ion energy distributions were bell-shaped curves with a peak 10 to 20 V below anode potential and with ion energies extending 30 to 40 V on either side of the peak

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

Energy Technology Data Exchange (ETDEWEB)

Hirata, K., E-mail: k.hirata@aist.go.jp [National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565 (Japan); Saitoh, Y.; Chiba, A.; Yamada, K.; Narumi, K. [Takasaki Advanced Radiation Research Institute (TARRI), Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292 (Japan)

2013-11-01

Energetic cluster ions with energies of the order of sub MeV or greater were applied to time-of-flight (TOF) secondary ion (SI) mass spectrometry. This gave various advantages including enhancement of SIs required for chemical structure characterization and prevention of charging effects in SI mass spectra for organic targets. We report some characteristic features of TOF SI mass spectrometry using energetic cluster ion impact ionization and discuss two future applications of it.

Surface potential measurement of the insulator with secondary electron caused by negative ion implantation

International Nuclear Information System (INIS)

Tsuji, Hiroshi; Toyota, Yoshitaka; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1994-01-01

Ion implantation has the merit of the good controllability of implantation profile and low temperature process, and has been utilized for the impurity introduction in LSI production. However, positive ion implantation is carried out for insulator or insulated conductor substrates, their charged potential rises, which is a serious problem. As the requirement for them advanced, charge compensation method is not the effective means for resolving it. The negative ion implantation in which charging is little was proposed. When the experiment on the negative ion implantation into insulated conductors was carried out, it was verified that negative ion implantation is effective as the implantation process without charging. The method of determining the charged potential of insulators at the time of negative ion implantation by paying attention to the energy distribution of the secondary electrons emitted from substrates at the time was devised. The energy analyzer for measuring the energy distribution of secondary electrons was made, and the measurement of the charged potential of insulators was carried out. The principle of the measurement, the measuring system and the experimental results are reported. (K.I.)

Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions.

Science.gov (United States)

Zeng, Lixia; Zhou, Xianming; Cheng, Rui; Wang, Xing; Ren, Jieru; Lei, Yu; Ma, Lidong; Zhao, Yongtao; Zhang, Xiaoan; Xu, Zhongfeng

2017-07-25

Secondary electron emission yield from the surface of SiC ceramics induced by Xe 17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463-659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 57% for 3.2 MeV Xe 17+ impact, and about 62% for 4.0 MeV Xe 17+ impact, which is much larger than the decrease observed previously for ion impact at low charged states. The yield dependence on the temperature is discussed in terms of work function, because both kinetic electron emission and potential electron emission are influenced by work function. In addition, our experimental data show that the total electron yield gradually increases with the kinetic energy of projectile, when the target is at a constant temperature higher than room temperature. This result can be explained by electronic stopping power which plays an important role in kinetic electron emission.

Effect of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity, Saumyen; Banerjee, Soumyajyoti

2011-01-01

In this paper, we have investigated the role of secondary electron emission on Jean's instability in a complex plasma in the presence of nonthermal ions. The equilibrium dust surface potential has been considered negative and hence primary and secondary electron temperatures are equal. Such plasma consists of three components: Boltzman distributed electrons, nonthermal ions and negatively charged inertial dust grains. From the linear dispersion relation, we have calculated the real frequency and growth rate of Jean's instability. Numerically, we have shown that for strong ion nonthermality Jean's mode is unstable. Growth of the instability reduces and the real part of the wave frequency increases with increasing secondary electron emission from dust grains. Hence, strong secondary electron emission suppresses Jean's instability in a complex plasma even when ion nonthermality is strong and equilibrium dust charge is negative.

Measurement of secondary particle production induced by particle therapy ion beams impinging on a PMMA target

Directory of Open Access Journals (Sweden)

Toppi M.

2016-01-01

Full Text Available Particle therapy is a technique that uses accelerated charged ions for cancer treatment and combines a high irradiation precision with a high biological effectiveness in killing tumor cells [1]. Informations about the secondary particles emitted in the interaction of an ion beam with the patient during a treatment can be of great interest in order to monitor the dose deposition. For this purpose an experiment at the HIT (Heidelberg Ion-Beam Therapy Center beam facility has been performed in order to measure fluxes and emission profiles of secondary particles produced in the interaction of therapeutic beams with a PMMA target. In this contribution some preliminary results about the emission profiles and the energy spectra of the detected secondaries will be presented.

Secondary Electron Emission from Solid Hydrogen and Deuterium Resulting from Incidence of keV Electrons and Hydrogen Ions

DEFF Research Database (Denmark)

Sørensen, H.

1977-01-01

are small, in contrast to what is expected for insulating materials. One explanation is that the secondary electrons lose energy inside the target material by exciting vibrational and rotational states of the molecules, so that the number of electrons that may escape as secondary electrons is rather small....... The losses to molecular states will be largest for hydrogen, so that the SEE coefficients are smallest for solid hydrogen, as was observed. For the incidence of ions, the values of δ for the different molecular ions agree when the number of secondary electrons per incident atom is plotted versus the velocity...... or the stopping power of the incident particles. Measurements were also made for oblique incidence of H+ ions on solid deuterium for angles of incidence up to 75°. A correction could be made for the emission of secondary ions by also measuring the current calorimetrically. At largest energies, the angular...

Study of the secondary negative ion emission of copper and several of its alloys by impact with Cs+ ions

International Nuclear Information System (INIS)

Vallerand, P.; Baril, M.

1977-01-01

Secondary ion emission studies have been undertaken using Cs + as the primary ion beam. A good vacuum (ca. 10 -8 torr) is needed to eliminate contamination by residual gases. Negative ion emission of pure copper is compared with its alloys. The thermodynamic equilibrium model of Andersen is discussed. For low element concentrations, the experimental data show enhancement in negative emission of P, Al, Fe, Sn, Ni, and attenuation for Zn, Pb. The order of magnitude of ionic efficiency S - for copper is evaluated at 10 -4 . (Auth.)

Application of secondary ion mass spectrometry (SIMS) to biological sample analysis

International Nuclear Information System (INIS)

Tamura, Hifumi

1990-01-01

Some major issues and problems related with the analysis of biological samples are discussed, focusing on demonstrated and possible solutions and the application of secondary ion mass spectrometry (SIMS) to investigation of the composition of biological samples. The effective use of secondary electrons in combination with negative ions is most practical for the analysis of biological samples. Regardless of whether positive or negative ions are used, the electric potential at the surface of a sample stays around a constant value because of the absense of the accumulation of electric charges at the surface, leading to almost complete avoidance of the charging of the biological sample. A soft tissue sample can suffer damage to the tissue or migration of atoms in removing water from the sample. Some processes including fixation and freeze drying are available to prevent this. The application of SIMS to biological analysis is still in the basic research stage and further studies will be required to develop practical methods. Possible areas of its application include medicine, pathology, toxicology, pharmacology, plant physiology and other areas related with marine life and marine contamination. (N.K.)

Jean’s instability in a complex plasma in presence of secondary electrons and nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity Saumyen

2013-01-01

In this paper we have investigated the effect of secondary electron emission and nonthermality of ion velocity distribution simultaneously on Jean’s instability in a complex plasma in presence of negatively charged dust grains. Primary and secondary electron temperatures are assumed to be equal. Thus plasma under consideration consists of Boltzmann distributed electrons, nonthermal ions and negatively charged dust grains. The dust grain component is modeled by continuity and momentum equations. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically it is found that for lower values of the nonthermal parameter Jean’s instability is higher for higher secondary electron emission whereas the effect of secondary electron emission on Jean’s instability becomes insignificant for higher values of the nonthermal parameter. (author)

Microporous carbon derived from polyaniline base as anode material for lithium ion secondary battery

International Nuclear Information System (INIS)

Xiang, Xiaoxia; Liu, Enhui; Huang, Zhengzheng; Shen, Haijie; Tian, Yingying; Xiao, Chengyi; Yang, Jingjing; Mao, Zhaohui

2011-01-01

Highlights: → Nitrogen-containing microporous carbon was prepared from polyaniline base by K 2 CO 3 activation, and used as anode material for lithium ion secondary battery. → K 2 CO 3 activation promotes the formation of amorphous and microporous structure. → High nitrogen content, and large surface area with micropores lead to strong intercalation between carbon and lithium ion, and thus improve the lithium storage capacity. -- Abstract: Microporous carbon with large surface area was prepared from polyaniline base using K 2 CO 3 as an activating agent. The physicochemical properties of the carbon were characterized by scanning electron microscope, X-ray diffraction, Brunauer-Emmett-Teller, elemental analyses and X-ray photoelectron spectroscopy measurement. The electrochemical properties of the microporous carbon as anode material in lithium ion secondary battery were evaluated. The first discharge capacity of the microporous carbon was 1108 mAh g -1 , whose first charge capacity was 624 mAh g -1 , with a coulombic efficiency of 56.3%. After 20 cycling tests, the microporous carbon retains a reversible capacity of 603 mAh g -1 at a current density of 100 mA g -1 . These results clearly demonstrated the potential role of microporous carbon as anode for high capacity lithium ion secondary battery.

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range

International Nuclear Information System (INIS)

Vidovic, Z.

1997-06-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Miśnik, Maciej [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Gdańsk University of Technology (Poland); Konarski, Piotr [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Zawada, Aleksander [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Military University of Technology, Warszawa (Poland)

2016-03-15

We present results of the use of metal and metal oxide substrates that serve as collectors in ‘storing matter’, the quantitative technique of secondary ion mass spectrometry (SIMS). This technique allows separating the two base processes of secondary ion formation in SIMS. Namely, the process of ion sputtering is separated from the process of ionisation. The technique allows sputtering of the analysed sample and storing the sputtered material, with sub-monolayer coverage, onto a collector surface. Such deposits can be then analysed by SIMS, and as a result, the so called ‘matrix effects’ are significantly reduced. We perform deposition of the sputtered material onto Ti and Cu substrates and also onto metal oxide substrates as molybdenum, titanium, tin and indium oxides. The process of sputtering is carried within the same vacuum chamber where the SIMS analysis of the collected material is performed. For sputtering and SIMS analysis of the deposited material we use 5 keV Ar{sup +} beam of 500 nA. The presented results are obtained with the use of stationary collectors. Here we present a case study of chromium. The obtained results show that the molybdenum and titanium oxide substrates used as collectors increase useful yield by two orders, with respect to such pure elemental collectors as Cu and Ti. Here we define useful yield as a ratio of the number of detected secondary ions during SIMS analysis and the number of atoms sputtered during the deposition process.

Control of secondary electrons from ion beam impact using a positive potential electrode

Energy Technology Data Exchange (ETDEWEB)

Crowley, T. P., E-mail: tpcrowley@xanthotechnologies.com; Demers, D. R.; Fimognari, P. J. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams

NARCIS (Netherlands)

Castaldo, V.; Withagen, J.; Hagen, C.; Kruit, P.; Van Veldhoven, E.

2011-01-01

In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strongly dependent on the surface characteristics, in

Compositional changes of human hair melanin resulting from bleach treatment investigated by nanoscale secondary ion mass spectrometry.

Science.gov (United States)

Kojima, Toru; Yamada, Hiromi; Isobe, Mitsuru; Yamamoto, Toshihiko; Takeuchi, Miyuki; Aoki, Dan; Matsushita, Yasuyuki; Fukushima, Kazuhiko

2014-11-01

It is important to understand the influence of bleach treatment on human hair because it is one of the most important chemical treatments in hair cosmetic processes. A comparison of the elemental composition of melanin between virgin hair and bleached hair would provide important information about the structural changes of melanin. To investigate the elemental composition of melanin granules in virgin black hair and bleached hair, these hair cross-sections are analyzed by using a nanoscale secondary ion mass spectrometry (NanoSIMS). The virgin black hair and bleached hair samples were embedded in resin and smooth hair cross-sections were obtained using an ultramicrotome. NanoSIMS measurements were performed using a Cs(+) primary ion beam to detect negative secondary ions. More intensive (16) O(-) ions were detected from the melanin granules of bleached hair than from those of virgin black hair in NanoSIMS (16) O(-) ion image. In addition, it was indicated that (16) O(-) ion intensity and (16) O(-) /(12) C(14) N(-) ion intensity ratio of melanin granules in bleached hair were higher than those in virgin black hair. Nanoscale secondary ion mass spectrometry analysis of the cross-sections of virgin black hair and bleached hair indicated that the oxygen content in melanin granules was increased by bleach treatment. © 2014 John Wiley & Sons A/S. Published by John Wiley & Sons Ltd.

Gas discharge ion source. II. Duopigatron

International Nuclear Information System (INIS)

Bacon, F.M.; Bickes, R.W. Jr.; O'Hagan, J.B.

1978-01-01

Ion source performance characteristics consisting of total ion current, ion energy distribution, mass distribution, and ion current density distribution have been measured for several models of a duopigatron. Variations on the duopigatron design involved plasma expansion cup material and dimensions, secondary cathode material, and interelectrode spacings. Of the designs tested, the one with a copper and molybdenum secondary cathode, and a mild steel plasma expansion cup proved to give the best results. The ion current density distribution was peaked at the center of the plasma expansion cup and fell off to 80% of the peak value at the cup wall for a cup 15.2 mm deep. A total ion current of 180 mA consisting of 60%-70% atomic ions was produced with an arc current of 20 A and source pressure of 9.3 Pa. More shallow cups produced a larger beam current and a more sharply peaked ion current density distribution. Typical ion energy distributions were bellshaped curves with a peak 10-20 V below anode potential and with ion energies extending 30-40 V on either side of the peak

The Adsorption of n-Octanohydroxamate Collector on Cu and Fe Oxide Minerals Investigated by Static Secondary Ion Mass Spectrometry

Directory of Open Access Journals (Sweden)

Alan N. Buckley

2012-12-01

Full Text Available The feasibility of investigating the adsorption of n-octanohydroxamate collector on copper and iron oxide minerals with static secondary ion mass spectrometry has been assessed. Secondary ion mass spectra were determined for abraded surfaces of air-exposed copper metal, malachite, pseudomalachite and magnetite that had been conditioned in aqueous potassium hydrogen n-octanohydroxamate solution, as well as for the corresponding bulk CuII and FeIII complexes. In each case, the chemical species present at the solid/vacuum interface of a similarly prepared surface were established by X-ray photoelectron spectroscopy. The most abundant positive and negative metal-containing fragment ions identified for the bulk complexes were also found to be diagnostic secondary ions for the collector adsorbed on the oxide surfaces. The relative abundances of those diagnostic ions varied with, and could be rationalised by, the monolayer or multilayer coverage of the adsorbed collector. However, the precise mass values for the diagnostic ions were not able to corroborate the different bonding in the copper and iron hydroxamate systems that had been deduced from photoelectron and vibrational spectra. Parent secondary ions were able to provide supporting information on the co-adsorption of hydroxamic acid at each conditioned surface.

Magnetic insulation of secondary electrons in plasma source ion implantation

International Nuclear Information System (INIS)

Rej, D.J.; Wood, B.P.; Faehl, R.J.; Fleischmann, H.H.

1993-01-01

The uncontrolled loss of accelerated secondary electrons in plasma source ion implantation (PSII) can significantly reduce system efficiency and poses a potential x-ray hazard. This loss might be reduced by a magnetic field applied near the workpiece. The concept of magnetically-insulated PSII is proposed, in which secondary electrons are trapped to form a virtual cathode layer near the workpiece surface where the local electric field is essentially eliminated. Subsequent electrons that are emitted can then be reabsorbed by the workpiece. Estimates of anomalous electron transport from microinstabilities are made. Insight into the process is gained with multi-dimensional particle-in-cell simulations

Effect of Weakly Nonthermal Ion Velocity Distribution on Jeans Instability in a Complex Plasma in Presence of Secondary Electrons

International Nuclear Information System (INIS)

Sarkar, S.; Maity, S.

2013-01-01

In this paper we have investigated the effect of weak nonthermality of ion velocity distribution on Jean’s instability in a complex plasma in presence of secondary electrons and negatively charged dust grains. The primary and secondary electron temperatures are assumed equal. Thus plasma under consideration consists of three components: Boltzman distributed electrons, non-thermal ions and negatively charged inertial dust grains. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically we have found that secondary electron emission destabilizes Jean’s mode when ion nonthermality is weak. (author)

South African dietary total antioxidant capacity based on secondary ...

African Journals Online (AJOL)

Objective: In this exploratory study, the average adult South African dietary total antioxidant capacity (TAC) was estimated using secondary data and was evaluated against that determined for dietary intake recommendations. Design: The average adult South African dietary TAC was estimated using a report published by ...

Study of the secondary negative ion emission of copper and several of its alloys by impact with Cs/sup +/ ions

Energy Technology Data Exchange (ETDEWEB)

Vallerand, P; Baril, M [Laval Univ., Quebec City (Canada). Dept. de Physique

1977-07-01

Secondary ion emission studies have been undertaken using Cs/sup +/ as the primary ion beam. A good vacuum (ca. 10/sup -8/ torr) is needed to eliminate contamination by residual gases. Negative ion emission of pure copper is compared with its alloys. The thermodynamic equilibrium model of Andersen is discussed. For low element concentrations, the experimental data show enhancement in negative emission of P, Al, Fe, Sn, Ni, and attenuation for Zn, Pb. The order of magnitude of ionic efficiency S/sup -/ for copper is evaluated at 10/sup -4/.

Application of secondary ion emission to impurity control in tokamaks

International Nuclear Information System (INIS)

Krauss, A.R.; Gruen, D.M.

1979-01-01

The extent to which high Z impurities enter the plasma of a magnetic confinement fusion device depends on the kinetic energy, angle of emission, and very importantly, the charge state of the ejected material. We have been studying both the fundamental process of secondary ion emission and possible techniques for producing surfaces which give rise to high ion fractions during sputtering, with a view to assessing the potential of this approach to impurity control in tokamaks. By carefully choosing materials exposed to fusion plasmas and by properly modifying the surface it may be possible to insure that nearly all the impurities are ejected as ions. As long as certain gas blanket configurations are avoided and especially if a divertor is used, it should then be possible to remove the impurities before they reach the plasma. The relative merits of a variety of materials are considered with regard to this application

New experiments in organic, fast-atom-bomdardment, and secondary-ion mass spectrometry

International Nuclear Information System (INIS)

DiDonato, G.C.

1987-01-01

The goal of research presented in this dissertation is the creative use of new ionization and instrumental techniques in mass spectrometry. This goal manifests itself in three areas of mass spectrometry. In the first portion, modern, state-of-the-art instrumentation and new experiments were used to re-examine the mass spectra of transition-metal acetates and acetylacetonates. High resolution, chemical ionization, negative chemical ionization, and extended-mass-range mass spectrometry uncovered a wealth of new gas-phase ionic species. Energy-resolved mass spectrometry/mass spectrometry was applied to the characterization of molecular and fragment ion first-row transition-metal acetylacetonates, and comprises the second portion of the thesis. Studies in fast-atom-bombardment mass spectrometry are the subject of the third portion of the dissertation. Since fast-atom bombardment samples a liquid matrix, absolute and relative abundances of sputtered secondary ions are influenced by solution chemistry. The design and construction of an imaging secondary-ion mass spectrometer is the subject of the final portion of the thesis. This instrument provides for direct mass-spectrometric analysis of thin-layer and paper chromatograms and electrophoretograms

Proceedings of the RCNP cascade project workshop 'heavy ion secondary beam course'

International Nuclear Information System (INIS)

1991-10-01

In the Research Center for Nuclear Physics (RCNP), Osaka University, as one of the experimental facilities utilizing the heavy ion beam from the ring cyclotron, the construction of the heavy ion secondary beam course has been in progress. This course can supply the unstable nuclei produced by a heavy ion reaction as a secondary beam, and is expected to become the powerful experimental facility for elucidating the condition of atomic nuclei in the extreme condition and their reaction mode. At present, the arrangement is advanced aiming at the utilization from the end of fiscal year 1991. Toward the start of joint utilization experiment, in order to examine the expected physics, concrete experimental plan and the preparation plan accompanying them, the workshop including the introduction of the course was held. On December 15, 1990, the workshop with the theme on the nuclear reaction by unstable nucleus beam was held, and on January 26, 1991, that with the theme on the spectroscopy of unstable nuclei was held. In each meeting, there were more than 20 participants. In this report, the gists of 18 papers are collected. (K.I.)

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

OpenAIRE

Moritomo, Yutaka; Goto, Kensuke; Shibata, Takayuki

2015-01-01

Manganese hexacyanoferrate (Mn-PBA) is a promising cathode material forsodium-ion secondary battery (SIB) with high average voltage (=3.4 V) against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grown)to 15 C (glucose-treated). Our observation suggests that thermal tr...

The heavy-ion total reaction cross-section and nuclear transparancy

International Nuclear Information System (INIS)

Rego, R.A.; Hussein, M.S.

1982-10-01

The total reaction cross section of heavy ions at intermediate energies is discussed. The special role played by the individual nucleon-nucleon collisions in determining the nuclear transparancy is analysed. Several competing effects arising from the nuclear and Coulomb interactions between the two ions are found to be important in determing σ sub(R) at lower energies. (Author) [pt

The heavy-ion total reaction cross-section and nuclear transparency

International Nuclear Information System (INIS)

Rego, R.A.; Hussein, M.S.

1982-01-01

The total reaction cross section of heavy ions at intermediate energies is discussed. The special role played by the individual nucleon-nucleon collisions in determining the nuclear transparency is analysed. Several competing effects arising from the nuclear and Coulomb interactions between the two ions are found to be important in determining σ(sub R) at lower energies. (Author) [pt

Secondary emission from a CuBe target due to bombardment with parent and fragment ions of ammonia and phosphine

International Nuclear Information System (INIS)

Maerk, T.D.

1977-01-01

The secondary electron emission of the first dynode of a CuBe alloy sixteen dynode electron multiplier has been studied in the course of electron impact ionization studies of ammonia and phosphine. Relative secondary electron emission coefficients have been obtained for the singly and doubly charged parent and fragment ions of ammonia, ammonia-d 3 , phosphine and phosphine-d 3 for kinetic energies of 5,25 and 10,5 keV. It has been found, that in general deuterated ions have smaller γ coefficients, that ammonia ions have larger γ coefficients than corresponding phosphine ions, and that the γ coefficients increase with the complexity of the ion under study. (Auth.)

Secondary electron/reflected particle coincidence studies during slow highly charged ion-surface interactions

Energy Technology Data Exchange (ETDEWEB)

McGrath, C.T.; Szilagyi, Z.; Shah, M.B.; McCullough, R.W. [Queen' s Univ., Belfast, Northern Ireland (United Kingdom); Woolsey, J.M. [Stirling Univ. (United Kingdom). DBMS; Trassl, R.; Salzborn, E. [Giessen Univ. (Germany). Inst. fuer Kernphysik

2001-07-01

We have measured the secondary electron emission statistics (ES) for 5 keV N{sup q+} (q = 1-4) ions incident at 10 on polycrystalline aluminium, in coincidence with specularly reflected N{sup 0}. In this arrangement the kinetic contribution to secondary electron emission is minimised. The experimental data shows that the coincident electron yield, {gamma}, increases linearly with incident ion charge state. The kinetic emission contribution has also been determined from this data. The ES due to 2 and 4 keV He{sup 2+} impact on polycrystalline aluminium in coincidence with specularly reflected He{sup +} and He{sup 0} have also been determined. The process He{sup 2+} {yields} He{sup 0} yields a larger {gamma} value than the process He{sup 2+} {yields} He{sup +}. (orig.)

Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

International Nuclear Information System (INIS)

Wright, R.B.; Gruen, D.M.

1980-01-01

Secondary photon and secondary ion emission during energetic particle irradiation of solid surfaces is assumed to arise due to excitation and de-excitation of sputtered particles originating from a collision cascade induced by the incident projectile. The excitation is postulated to occur by two alternative mechanisms: path (a), where excitation occurs at or very near the surface of the solid due to atom--atom or atom--electron collisions; and path (b), where excitation occurs as the sputtered particle leaves the solid, but is still under its influence so that electron exchange processes are permitted. Once the excited and/or ionized sputtered particle is formed nonradiative de-excitation processes are then included in the discussion which allow the excited and/or ionized particle to be de-excited and/or neutralized. The result of these nonradiative de-excitation processes is shown to provide a possible channel for the formation of new excited ''daughters'' by the de-excitation of the initial excited ''parent''. Depending on the initial excitation probability of the parent the new excited daughters are shown to contribute to various energy regions of the excited and/or ionized secondary particle energy distribution. A mathematical formalism is developed based on the neutral sputtered atom energy and velocity distributions assuming a collision cascade origin for these sputtered particles. By including various models for the excitation probability, and the survival probability for excited particles once formed to not undergo nonradiative de-excitation the resulting energy and velocity distributions of the sputtered excited and/or ionized secondary particles are calculated. These distributions are found to be a function of the emission angle depending on the model assumed for the initial excitation. From this formalism the total excited secondary particle yield may be calculated

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

Directory of Open Access Journals (Sweden)

G. Fubiani

2008-01-01

Full Text Available The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses. The resulting secondary particles (positive ions, neutrals, and electrons are accelerated and deflected by the electric and magnetic fields inside the accelerator and may induce more secondaries after a likely impact with the accelerator grids. This chain of reactions is responsible for a non-negligible heat load on the grids and must be understood in detail. In this paper, we will provide a comprehensive summary of the physics involved in the process of secondary emission in a typical ITER-like negative ion electrostatic accelerator together with a precise description of the numerical method and approximations involved. As an example, the multiaperture-multigrid accelerator concept will be discussed.

Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Ewinger, H.P.

1993-05-01

This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C 2 , CH 2 , C 2 H, and C 3 , as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with suitable signal patterns. (orig./BBR) [de

Real-Time Online Monitoring of the Ion Range by Means of Prompt Secondary Radiations

International Nuclear Information System (INIS)

Krimmer, J.; Balleyguier, L.; Caponetto, L.; Chen, X.; Dahoumane, M.; Dauvergne, D.; De Rydt, M.; Dedes, G.; Della Negra, R.; Deng, S.M.; Ley, J.L.; Mathez, H.; Pinto, M.; Ray, C.; Richard, M.H.; Reithinger, V.; Roellinghoff, F.; Testa, E.; Zoccarato, Y.; Baudot, J.; Winter, M.; Brons, S.; Chabot, M.; Force, P.; Joly, B.; Insa, C.; Lambert, D.; Lestand, L.; Magne, M.; Montarou, G.; Freud, N.; Letang, J.M.; Lojacono, X.; Maxim, V.; Prostk, R.; Herault, J.; La Tessa, C.; Pleskac, R.; Vanstalle, M.; Parodi, K.; Prieels, D.; Smeets, J.; Rinaldi, I.

2013-06-01

Prompt secondary radiations such as gamma rays and protons can be used for ion-range monitoring during ion therapy either on an energy-slice basis or on a pencil-beam basis. We present a review of the ongoing activities in terms of detector developments, imaging, experimental and theoretical physics issues concerning the correlation between the physical dose and hadronic processes. (authors)

Comparison of secondary ion emission induced in silicon oxide by MeV and KeV ion bombardment

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.; Szymczak, W.; Wittmaack, K.

1993-09-01

The surface and near-surface composition of SiO 2 layers, has been investigated by negative secondary ion emission mass spectrometry (SIMS) using MeV and KeV ion bombardment in combination with time-of-flight (TOF) mass analysis. The spectra recorded in the mass range 0-100 u are dominated by surface impurities, notably hydrocarbons and silicon polyanions incorporating H and OH entities. The characteristic (fragmentation) patterns are quite different for light and high-velocity ion impact. In high-velocity TOF-SIMS analysis of P-doped layers, prepared by chemical vapour deposition (CVD), the mass lines at 63 and 79 u are very prominent and appear to correlate with the phosphorus concentration (PO 2 and PO 3 , respectively). It is shown, however, that for unambiguous P analysis one has to use dynamic SIMS or high mass resolution. (author) 11 refs., 5 figs

Observation of reduction of secondary electron emission from helium ion impact due to plasma-generated nanostructured tungsten fuzz

International Nuclear Information System (INIS)

Hollmann, E M; Doerner, R P; Nishijima, D; Pigarov, A Yu

2017-01-01

Growth of nanostructured fuzz on a tungsten target in a helium plasma is found to cause a significant (∼3×) reduction in ion impact secondary electron emission in a linear plasma device. The ion impact secondary electron emission is separated from the electron impact secondary electron emission by varying the target bias voltage and fitting to expected contributions from electron impact, both thermal and non-thermal; with the non-thermal electron contribution being modeled using Monte-Carlo simulations. The observed (∼3×) reduction is similar in magnitude to the (∼2×) reduction observed in previous work for the effect of tungsten fuzz formation on secondary electron emission due to electron impact. It is hypothesized that the observed reduction results from re-absorption of secondary electrons in the tungsten fuzz. (paper)

Characteristics of a wire ion plasma source and a secondary emission electron gun

International Nuclear Information System (INIS)

Hotta, Eiki; Osawa, Teruya; Urai, Hajime; Suzuki, Mitsuaki; Yasui, Hiroyuki; Tamagawa, Tohru

1993-01-01

Electrical characteristics of a wire ion plasma source (WIPS) and a secondary emission electron gun, for which the WIPS is used as an ion source, will be reported. The WIPS is a cold-cathode gaseous discharge device, in which a radial electron trapping permits an extremely low pressure gaseous discharge with very low applied voltages. The time evolutions of temperature and density of afterglow plasma were measured with a double probe. In the case of P 0 = 25 mTorr He and the maximum discharge current of 200 A, the temperature and density of electron were about 20 eV and of the order of 10 18 m -3 , respectively, just after the distinction of discharge. The ion current density measured by a biased ion collector (BIC) on the discharge tube wall was found to reach up to 300 mA/cm 2 . A secondary emission electron gun was set on the discharge tube wall opposite to the BIC. An earthed mesh net is installed at a height of 8 mm just in front of the cathode. The maximum negative bias voltage applied to the cathode is limited to -50 kV by the local breakdown in the gun, which occurred synchronously with the WIPS discharge. The electron beam current was measured by the BIC, in which an aluminum foil with a width of 2 μm was placed on instead of the earthed mesh net. At the cathode voltage of -30 kV, the measured beam current density was 220 mA/cm 2 . The extraporation of the resulted curve indicates that if the cathode voltage is -100 kV, the current density will reach to 1 A/cm 2 . The energy spectrum of the electron beam was measured with a magnetic energy analyzer, which was set in place of the BIC. The energy spread is about 300 eV at the central energy of 40 keV. Thus, they demonstrated the possibility of a high current density secondary emission electron gun, for which a WIPS is used as an ion source

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

Directory of Open Access Journals (Sweden)

Yutaka Moritomo

2015-09-01

Full Text Available Manganese hexacyanoferrate (Mn-PBA is a promising cathode material forsodium-ion secondary battery (SIB with high average voltage (=3.4 V against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grownto 15 C (glucose-treated. Our observation suggests that thermal treatment is quite effectivefor insulating coordination polymers.

Modeling secondary electron emission from nanostructured materials in helium ion microscope

International Nuclear Information System (INIS)

Ohya, K.; Yamanaka, T.

2013-01-01

Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

An algorithm to calculate secondary sputtering by the reflection of ions in two dimensions

International Nuclear Information System (INIS)

Smith, R.; Tagg, M.A.

1986-01-01

A method for computing the secondary sputtering of ions reflected from two-dimensional surfaces is described. The surface contour is first approximated by a set of line segments and the displacement of these line segments under ion erosion is determined computationally, by summing the contributions of the primary and reflected fluxes. This method can be used as an alternative to the method of characteristics which is normally used to determine primary ion beam effects. Some simple examples are evaluated. These examples illustrate that primary surface erosion theory is not in itself sufficient to explain the topography which can exist on an ion-eroded surface, particularly close to steep-sided structures. (author)

Contributions of secondary fragmentation by carbon ion beams in water phantom: Monte Carlo simulation

International Nuclear Information System (INIS)

Ying, C K; Bolst, David; Tran, Linh T.; Guatelli, Susanna; Rosenfeld, A. B.; Kamil, W A

2017-01-01

Heavy-particle therapy such as carbon ion therapy is currently very popular because of its superior conformality in terms of dose distribution and higher Relative Biological Effectiveness (RBE). However, carbon ion beams produce a complex mixed radiation field, which needs to be fully characterised. In this study, the fragmentation of a 290 MeV/u primary carbon ion beam was studied using the Geant4 Monte Carlo Toolkit. When the primary carbon ion beam interacts with water, secondary light charged particles (H, He, Li, Be, B) and fast neutrons are produced, contributing to the dose, especially after the distal edge of the Bragg peak. (paper)

Secondary particle tracks generated by ion beam irradiation

Science.gov (United States)

García, Gustavo

2015-05-01

The Low Energy Particle Track Simulation (LEPTS) procedure is a powerful complementary tool to include the effect of low energy electrons and positrons in medical applications of radiation. In particular, for ion-beam cancer treatments provides a detailed description of the role of the secondary electrons abundantly generated around the Bragg peak as well as the possibility of using transmuted positron emitters (C11, O15) as a complement for ion-beam dosimetry. In this study we present interaction probability data derived from IAM-SCAR corrective factors for liquid environments. Using these data, single electron and positron tracks in liquid water and pyrimidine have been simulated providing information about energy deposition as well as the number and type of interactions taking place in any selected ``nanovolume'' of the irradiated area. In collaboration with Francisco Blanco, Universidad Complutense de Madrid; Antonio Mu noz, Centro de Investigaciones Energéticas Medioambientales y Tecnológicas and Diogo Almeida, Filipe Ferreira da Silva, Paulo Lim ao-Vieira, Universidade Nova de Lisboa. Supported by the Spanish and Portuguese governments.

Time-of-flight secondary-ion mass spectrometry on thiole self-assembly monolayers on gold; Flugzeit-Sekundaerionenmassenspektrometrie an Thiol self assembly Monolagen auf Gold

Energy Technology Data Exchange (ETDEWEB)

Schroeder, M.

2006-07-01

Aim of this thesis was to get a deeper understanding for the influence of different matrix effects on the emission of molecular secondary ions. For the estimation of the influence of the primary-ion surface interaction a series of different primary-ion species was applied, which differ by mass, kinetic energy, and composition (monoatomic or polyatomic). In the framework of the presented results different matrix effects were studied. For this systematically the influence of the substrate-thiolate, the thiolate-thiolate, and the primary-ion substrate interaction on the formation of characteristic secondary ions was quantified. For the corresponding considerations beside the thiolate secondary ions M{sup -} the gold-thiolate clusters of the type Au{sub x+1}M{sub x}{sup -} were referred to.

Co-Registered In Situ Secondary Electron and Mass Spectral Imaging on the Helium Ion Microscope Demonstrated Using Lithium Titanate and Magnesium Oxide Nanoparticles.

Science.gov (United States)

Dowsett, D; Wirtz, T

2017-09-05

The development of a high resolution elemental imaging platform combining coregistered secondary ion mass spectrometry and high resolution secondary electron imaging is reported. The basic instrument setup and operation are discussed and in situ image correlation is demonstrated on a lithium titanate and magnesium oxide nanoparticle mixture. The instrument uses both helium and neon ion beams generated by a gas field ion source to irradiate the sample. Both secondary electrons and secondary ions may be detected. Secondary ion mass spectrometry (SIMS) is performed using an in-house developed double focusing magnetic sector spectrometer with parallel detection. Spatial resolutions of 10 nm have been obtained in SIMS mode. Both the secondary electron and SIMS image data are very surface sensitive and have approximately the same information depth. While the spatial resolutions are approximately a factor of 10 different, switching between the different images modes may be done in situ and extremely rapidly, allowing for simple imaging of the same region of interest and excellent coregistration of data sets. The ability to correlate mass spectral images on the 10 nm scale with secondary electron images on the nanometer scale in situ has the potential to provide a step change in our understanding of nanoscale phenomena in fields from materials science to life science.

What Are Normal Metal Ion Levels After Total Hip Arthroplasty? A Serologic Analysis of Four Bearing Surfaces.

Science.gov (United States)

Barlow, Brian T; Ortiz, Philippe A; Boles, John W; Lee, Yuo-Yu; Padgett, Douglas E; Westrich, Geoffrey H

2017-05-01

The recent experiences with adverse local tissue reactions have highlighted the need to establish what are normal serum levels of cobalt (Co), chromium (Cr), and titanium (Ti) after hip arthroplasty. Serum Co, Cr, and Ti levels were measured in 80 nonconsecutive patients with well-functioning unilateral total hip arthroplasty and compared among 4 bearing surfaces: ceramic-on-ceramic (CoC); ceramic-on-polyethylene (CoP); metal-on-polyethylene (MoP), and dual mobility (DM). The preoperative and most recent University of California, Los Angeles (UCLA) and Western Ontario and McMaster Universities Arthritis Index (WOMAC) scores were compared among the different bearing surfaces. No significant difference was found among serum Co and Cr levels between the 4 bearing surface groups (P = .0609 and P = .1577). Secondary analysis comparing metal and ceramic femoral heads demonstrated that the metal group (MoP, modular dual mobility (Stryker Orthopedics, Mahwah, NJ) [metal]) had significant higher serum Co levels compared with the ceramic group (CoC, CoP, MDM [ceramic]) (1.05 mg/L ± 1.25 vs 0.59 mg/L ± 0.24; P = .0411). Spearman coefficient identified no correlation between metal ion levels and patient-reported outcome scores. No serum metal ion level differences were found among well-functioning total hip arthroplasty with modern bearing couples. Significantly higher serum Co levels were seen when comparing metal vs ceramic femoral heads in this study and warrants further investigation. Metal ion levels did not correlate with patient-reported outcome measures. Copyright © 2016 Elsevier Inc. All rights reserved.

The molecular mechanism of ion-dependent gating in secondary transporters.

Directory of Open Access Journals (Sweden)

Chunfeng Zhao

2013-10-01

Full Text Available LeuT-like fold Na-dependent secondary active transporters form a large family of integral membrane proteins that transport various substrates against their concentration gradient across lipid membranes, using the free energy stored in the downhill concentration gradient of sodium ions. These transporters play an active role in synaptic transmission, the delivery of key nutrients, and the maintenance of osmotic pressure inside the cell. It is generally believed that binding of an ion and/or a substrate drives the conformational dynamics of the transporter. However, the exact mechanism for converting ion binding into useful work has yet to be established. Using a multi-dimensional path sampling (string-method followed by all-atom free energy simulations, we established the principal thermodynamic and kinetic components governing the ion-dependent conformational dynamics of a LeuT-like fold transporter, the sodium/benzyl-hydantoin symporter Mhp1, for an entire conformational cycle. We found that inward-facing and outward-facing states of Mhp1 display nearly the same free energies with an ion absent from the Na2 site conserved across the LeuT-like fold transporters. The barrier separating an apo-state from inward-facing or outward-facing states of the transporter is very low, suggesting stochastic gating in the absence of ion/substrate bound. In contrast, the binding of a Na2 ion shifts the free energy stabilizing the outward-facing state and promoting substrate binding. Our results indicate that ion binding to the Na2 site may also play a key role in the intracellular thin gate dynamics modulation by altering its interactions with the transmembrane helix 5 (TM5. The Potential of Mean Force (PMF computations for a substrate entrance displays two energy minima that correspond to the locations of the main binding site S1 and proposed allosteric S2 binding site. However, it was found that substrate's binds to the site S1 ∼5 kcal/mol more favorable

Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)

International Nuclear Information System (INIS)

Gnaser, Hubert; Golser, Robin; Kutschera, Walter; Priller, Alfred; Steier, Peter; Vockenhuber, Christof

2004-01-01

The detection of small molecular dianions by secondary-ion mass spectrometry (SIMS) and by accelerator mass spectrometry (AMS) is compared. In SIMS, the existence of these dianions can be identified safely if the total mass number of the molecule is odd and the dianion is hence detected at a half-integral mass number. The occurrence of fragmentation processes which may interfere with this scheme, is illustrated by means of the energy spectra of singly and doubly charged negative cluster ions. As compared to SIMS, AMS can rely, in addition, on the break-up of molecular species in the stripping process: this allows to monitor the simultaneous arrival of several atomic constituents with a clear energetic pattern in coincidence at the detector. This feature is exemplified for the C 10 2- dianion

Secondary ion emission

International Nuclear Information System (INIS)

Krohn, V.E.

1976-01-01

The Saha-Langmuir equation that describes the equilibrium emission process, surface ionization, has also been used to describe ion yields observed in the non-equilibrium emission process, sputtering. In describing sputtering, it is probably best to include the potential due to an image charge in the expression for negative as well as positive ion yield and to treat the work function and the temperature as parameters having limited physical significance. Arguments are presented to suggest that sputtered material is not emitted from a plasma. (Auth.)

Analysis of trace elements by means of accelerator secondary ion mass spectrometry

International Nuclear Information System (INIS)

Ender, R.M.

1997-01-01

The analysis of material composition and trace element concentration is of increasing interest primarily in semiconductor technology but also in metallurgy, geology, biology and medicine. At present, Secondary Ion Mass Spectrometry (SIMS) is in many respects the best technique to provide 3-dimensional information on the distribution of trace elements with concentrations below 1 ppm. However, due to the presence of molecular ions the detectability of many trace elements it restricted because of molecular mass interferences. In addition, detectors used in SIMS have a background counting rate of 0.1-1 Hz, which further limits trace element analysis. In Accelerator Mass Spectrometry (AMS) long-lived radionuclides are detected free of molecular interferences and detector background at isotopic ratios as low as 10 -15 . Moreover, isobaric interferences can be reduced as well. In order to benefit from these advantages a combination of SIMS and AMS (Accelerator SIMS) has been proposed almost 20 years ago, but no facility has ever been fully developed. It has been the aim of this work to add a new sputtering chamber for AMS measurements of ultrapure semiconductor material to the existing PSI/ETH AMS facility. To fulfill the requirements of material analysis, an UHV chamber with special precautions against contamination has been built and adapted to the existing AMS setup. For sputtering, a commercial Cs gun with an ExB filter and a 1 o beam bend for neutral particle suppression is used to obtain a pure Cs ion beam. The gun is equipped with different apertures for varying the diameter of the beam spot. With the integrated scanning unit the 10 keV Cs beam can be rastered over approximately 1 mm 2 . This allows different applications such as bulk analysis, depth profiling and imaging. The secondary ion extraction is matched to the ion optical and geometrical requirements of the existing accelerator mass spectrometer. (author) figs., tabs., 67 refs

High mass accuracy and high mass resolving power FT-ICR secondary ion mass spectrometry for biological tissue imaging

NARCIS (Netherlands)

Smith, D.F.; Kiss, A.; Leach, F.E.; Robinson, E.W.; Paša-Tolić, L.; Heeren, R.M.A.

2013-01-01

Biological tissue imaging by secondary ion mass spectrometry has seen rapid development with the commercial availability of polyatomic primary ion sources. Endogenous lipids and other small bio-molecules can now be routinely mapped on the sub-micrometer scale. Such experiments are typically

Shielding data for hadron-therapy ion accelerators: Attenuation of secondary radiation in concrete

CERN Document Server

Agosteo, S; Sagia, E; Silari, M

2014-01-01

The secondary radiation field produced by seven different ion species (from hydrogen to nitrogen), impinging onto thick targets made of either iron or ICRU tissue, was simulated with the FLUKA Monte Carlo code, and transported through thick concrete shields: the ambient dose equivalent was estimated and shielding parameters evaluated. The energy for each ion beam was set in order to reach a maximum penetration in ICRU tissue of 290 mm (equivalent to the therapeutic range of 430 MeV/amu carbon ions). Source terms and attenuation lengths are given as a function of emission angle and ion species, along with fits to the Monte Carlo data, for shallow depth and deep penetration in the shield. Trends of source terms and attenuation lengths as a function of neutron emission angle and ion species impinging on tar- get are discussed. A comparison of double differential distributions of neutrons with results from similar simulation works reported in the literature is also included. The aim of this work is to provide shi...

A high brightness source for nano-probe secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Smith, N.S. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)], E-mail: n.smith@oregon-physics.com; Tesch, P.P.; Martin, N.P.; Kinion, D.E. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)

2008-12-15

The two most prevalent ion source technologies in the field of surface analysis and surface machining are the Duoplasmatron and the liquid metal ion source (LMIS). There have been many efforts in this area of research to develop an alternative source [; N.S. Smith, W.P. Skoczylas, S.M. Kellogg, D.E. Kinion, P.P. Tesch, O. Sutherland, A. Aanesland, R.W. Boswell, J. Vac. Sci. Technol. B 24 (6) (2006) 2902-2906] with the brightness of a LMIS and yet the ability to produce secondary ion yield enhancing species such as oxygen. However, to date a viable alternative has not been realized. The high brightness and small virtual source size of the LMIS are advantageous for forming high resolution probes but a significant disadvantage when beam currents in excess of 100 nA are required, due to the effects of spherical aberration from the optical column. At these higher currents a source with a high angular intensity is optimal and in fact the relatively moderate brightness of today's plasma ion sources prevail in this operating regime. Both the LMIS and Duoplasmatron suffer from a large axial energy spread resulting in further limitations when forming focused beams at the chromatic limit where the figure-of-merit is inversely proportional to the square of the energy spread. Also, both of these ion sources operate with a very limited range of ion species. This article reviews some of the latest developments and some future potential in this area of instrument development. Here we present an approach to source development that could lead to oxygen ion beam SIMS imaging with 10 nm resolution, using a 'broad area' RF gas phase ion source.

Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment

International Nuclear Information System (INIS)

Stevie, F.A.; Kahora, P.M.; Simons, D.S.; Chi, P.

1988-01-01

Changes in secondary ion yields of matrix and dopant species have been correlated with changes in surface topography during O + 2 bombardment of Si and GaAs. In Si, profiles were measured in (100) wafers at 6- and 8-keV impact energy. At 6 keV, a yield increase of about 70% occurred for Si + over a depth range of 2.5 to 3.5 μm, with changes in other species ranging from a decrease of ∼20% for Si + 3 to an increase of more than 25% for O + . The development of a rippled surface topography was observed in scanning electron micrographs over the same depth range. Similar effects occurred over a 3--5 μm depth range for 8-keV ions, and in (111) silicon at a depth of 3 to 4 μm for 6-keV ions. No differences were noted between p- and n-type silicon, or implanted and unimplanted silicon. In GaAs, profiles were measured in (100) wafers at 2.5-, 5.5-, and 8-keV impact energies. At 8 keV, a yield increase of about 70% was found for GaO + in the range 0.6--1.0 μm, with smaller changes for other matrix species. At 5.5 keV, similar effects were observed, but over a depth interval of 0.3 to 0.7 μm. No yield changes were detected at 2.5-keV impact energy. The yield changes at the higher energies were again correlated with the onset of changes in topography. No change in ion yield or surface topography was noted for Cs + bombardment of Si or GaAs. The topography and ion yield changes are affected by the angle of incidence and, for Si, the oxygen coverage. The results show that the practice of normalizing secondary ion mass spectrometry dopant profiles to a matrix signal must be modified for situations where matrix yield changes occur

Quantum molecular dynamics study on energy transfer to the secondary electron in surface collision process of an ion

International Nuclear Information System (INIS)

Shibahara, M; Satake, S; Taniguchi, J

2008-01-01

In the present study the quantum molecular dynamics method was applied to an energy transfer problem to an electron during ionic surface collision process in order to elucidate how energy of ionic collision transfers to the emitted electrons. Effects of various physical parameters, such as the collision velocity and interaction strength between the observed electron and the classical particles on the energy transfer to the electron were investigated by the quantum molecular dynamics method when the potassium ion was collided with the surface so as to elucidate the energy path to the electron and the predominant factor of energy transfer to the electron. Effects of potential energy between the ion and the electron and that between the surface molecule and the electron on the electronic energy transfer were shown in the present paper. The energy transfer to the observed secondary electron through the potential energy term between the ion and the electron was much dependent on the ion collision energy although the energy increase to the observed secondary electron was not monotonous through the potential energy between the ion and surface molecules with the change of the ion collision energy

Application of secondary ions mass spectrometry (SIMS) in studies of internal contamination

International Nuclear Information System (INIS)

Amaral, Ademir; Galle, Pierre; Colas-Linhart, Nicole

2000-01-01

Secondary Ion Mass Spectrometry (SIMS) permits the detection of stable and radioactive nuclides. Based on the ablation of specimens by ion bombardment this mass spectrometry method allows a rapid assessment of trace elements in biological samples. Its resolving mass power provides an efficient analytical method and, in particular, it makes possible accurate isotopic ratio determination. In this work, the application of SIMS has been investigated in studies of internal contamination. In vivo studies were carried out using duodenal tissue sections from rats contaminated with cerium. Tests were performed to localize this element as a result of the contamination. In this report, analytical procedures and the potential of SIMS in biological research are presented and discussed. (author)

Ultrasensitive probing of the protein resistance of PEG surfaces by secondary ion mass spectrometry

DEFF Research Database (Denmark)

Kingshott, P.; McArthur, S.; Thissen, H.

2002-01-01

The highly sensitive surface analytical techniques X-ray photoelectron spectroscopy (XPS) and time-of-flight static secondary ion mass spectrometry (ToF-SIMS) were used to test the resistance of poly(ethylene glycol) (PEG) coatings towards adsorption of lysozyme (LYS) and fibronectin (FN). PEG co...

Development of methodics for the characterization of the composition of the ion-collision-induced secondary-particle flux by comparison of the yield contributions of photoinduced ion formation processes; Entwicklung einer Methodik zur Charakterisierung der Zusammensetzung des ionenbeschussinduzierten Sekundaerteilchenflusses durch Vergleich der Ausbeuteanteile photoinduzierter Ionenbildungsprozesse

Energy Technology Data Exchange (ETDEWEB)

Vering, Guido

2008-10-13

The aim of this work was to develop a method to distinguish between different ion formation processes and to determine the influence of these processes on the total number of detected monatomic ions of a certain element. A vector/matrix-formalism was developed, which describes the physical processes of sputtering, ion formation, mass separation and detection in laser-SNMS. In the framework of the method developed, based on this theoretic formalism, changes in the secondary flux contribution of the respective element were observed by comparing the detected monatomic ion yield obtained in specifically aligned (SIMS and) laser-SNMS experiments. The yields resulting from these experiments were used to calculate characteristic numbers to compare the flux composition from different surfaces. The potential of the method was demonstrated for the elements boron, iron and gadolinium by investigating the changes in the flux composition of secondary particles sputtered from metallic surfaces, as a function of the oxygen concentration at the surface. Finally, combined laser-SNMS depth profiles and images, obtained with both laser systems, were presented to demonstrate how the parallel detection of the three differently originated ion signals of the same element can be used to get additional information about the composition of the flux of secondary particles synchronously during the analysis of elemental distributions. In this respect the presented method can be a very helpful tool to prevent misleading interpretations of SIMS or laser-SNMS data. (orig.)

Radioactive heavy ion secondary beams

International Nuclear Information System (INIS)

Bimbot, R.

1987-01-01

The production of secondary radioactive beams at GANIL using the LISE spectrometer is reviewed. The experimental devices, and secondary beam characteristics are summarized. Production of neutron rich secondary beams was studied for the systems Ar40 + Be at 44 MeV/u, and 018 + Be at 45 and 65 MeV/u. Partial results were also obtained for the system Ne22 + Ta at 45 MeV/u. Experiments using secondary beams are classified into two categories: those which correspond to fast transfer of nuclei from the production target to a well shielded observation point; and those in which the radioactive beam interacts with a secondary target

Feasibility of carbon-ion radiotherapy for re-irradiation of locoregionally recurrent, metastatic, or secondary lung tumors.

Science.gov (United States)

Hayashi, Kazuhiko; Yamamoto, Naoyoshi; Karube, Masataka; Nakajima, Mio; Tsuji, Hiroshi; Ogawa, Kazuhiko; Kamada, Tadashi

2018-03-02

Intrathoracic recurrence after carbon-ion radiotherapy for primary or metastatic lung tumors remains a major cause of cancer-related deaths. However, treatment options are limited. Herein, we report on the toxicity and efficacy of re-irradiation with carbon-ion radiotherapy for locoregionally recurrent, metastatic, or secondary lung tumors. Data of 95 patients with prior intrathoracic carbon-ion radiotherapy who were treated with re-irradiation with carbon-ion radiotherapy at our institution between 2006 and 2016 were retrospectively analyzed. Seventy-three patients (76.8%) had primary lung tumors and 22 patients (23.2%) had metastatic lung tumors. The median dose of initial carbon-ion radiotherapy was 52.8 Gy (relative biological effectiveness) and the median dose of re-irradiation was 66.0 Gy (relative biological effectiveness). None of the patients received concurrent chemotherapy. The median follow-up period after re-irradiation was 18 months. In terms of grade ≥3 toxicities, one patient experienced each of the following: grade 5 bronchopleural fistula, grade 4 radiation pneumonitis, grade 3 chest pain, and grade 3 radiation pneumonitis. The 2-year local control and overall survival rates were 54.0% and 61.9%, respectively. In conclusion, re-irradiation with carbon-ion radiotherapy was associated with relatively low toxicity and moderate efficacy. Re-irradiation with carbon-ion radiotherapy might be an effective treatment option for patients with locoregionally recurrent, metastatic, or secondary lung tumors. © 2018 The Authors. Cancer Science published by John Wiley & Sons Australia, Ltd on behalf of Japanese Cancer Association.

Electrochemical lithiation of silicon electrodes. Neutron reflectometry and secondary ion mass spectrometry investigations

Energy Technology Data Exchange (ETDEWEB)

Jerliu, Bujar; Doerrer, Lars; Hueger, Erwin [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Seidlhofer, Beatrix-Kamelia; Steitz, Roland [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Borchardt, Guenter; Schmidt, Harald [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Clausthaler Zentrum fuer Materialtechnik (CZM), Clausthal-Zellerfeld (Germany)

2017-11-15

In-situ neutron reflectometry and ex-situ secondary ion mass spectrometry in combination with electrochemical methods were used to study the lithiation of amorphous silicon electrodes. For that purpose specially designed closed three-electrode electrochemical cells with thin silicon films as the working electrode and lithium as counter and reference electrodes were used. The neutron reflectometry results obtained in-situ during galvanostatic cycling show that the incorporation, redistribution and removal of Li in amorphous silicon during a lithiation cycle can be monitored. It was possible to measure the volume modification during lithiation, which is found to be rather independent of cycle number, current density and film thickness and in good agreement with first-principles calculations as given in literature. Indications for an inhomogeneous lithiation mechanism were found by secondary ion mass spectrometry measurements. Lithium tracer diffusion experiments indicate that the diffusivities inside the lithiated region (D > 10{sup -15} m{sup 2} s{sup -1}) are considerably higher than in pure amorphous silicon as known from literature. This suggests a kinetics based explanation for the occurrence of an inhomogeneous lithiation mechanism.

Transient effects in SIMS analysis of Si with Cs sup + at high incidence angles Secondary ion yield variations

CERN Document Server

Heide, P A W

2002-01-01

Secondary ion mass spectrometry (SIMS) depth profile analysis of Si wafers using 1 keV Cs sup + primary ions at large incidence angles (80 deg. ) is plagued by unusually strong transient effects (variations in both sputter and ion yields). Analysis of a native oxide terminated Si wafer with and without the aid of an O sub 2 leak, and an Ar sup + pre-sputtered wafer revealed correlations between the implanted Cs content and various secondary ion intensities consistent with that expected from a resonance charge transfer process (that assumed by the electron tunneling model). Cs concentrations were defined through X-ray photoelectron spectroscopy of the sputtered surface from SIMS profiles terminated within the transient region. These scaled with the surface roughening occurring under these conditions and can be explained as resulting from the associated drop in sputter rates. An O induced transient effect from the native oxide was also identified. Characterization of these effects allowed the reconstruction of ...

Analysis of As implantation profiles in silica by nuclear microanalysis and secondary ion emission

International Nuclear Information System (INIS)

Dieumegard, D.; Croset, M.; Cohen, C.; Lhoir, A.; Rigo, S.; Chaumont, J.

1974-01-01

Results obtained from analysis using, either the method of elastic backscattering of light or semi-heavy ions ( 4 He + , 14 N + ) about one MeV energy, or the secondary ion emission method are compared. The choice of As implanted Si is explained by the following reasons: As is an element relatively heavy in comparison with Si, that allows an analysis to be effected on a few thousands Angstroems depth in silica using elastic backscattering; the silica chosen as substrate being an amorphous material allows channeling phenomena to the avoided during implantation and analysis [fr

The Early Entry of Al into Cells of Intact Soybean Roots (A Comparison of Three Developmental Root Regions Using Secondary Ion Mass Spectrometry Imaging).

Science.gov (United States)

Lazof, D. B.; Goldsmith, J. G.; Rufty, T. W.; Linton, R. W.

1996-11-01

Al localization was compared in three developmental regions of primary root of an Al-sensitive soybean (Glycine max) genotype using secondary ion mass spectrometry. In cryosections obtained after a 4-h exposure to 38 [mu]M [Al3+], Al had penetrated across the root and into the stele in all three regions. Although the greatest localized Al concentration was consistently at the root periphery, the majority of the Al in each region had accumulated in cortical cells. It was apparent that the secondary ion mass spectrometry 27Al+ mass signal was spread throughout the intracellular area and was not particularly intense in the cell wall. Inclusion of some cell wall in determinations of the Al levels across the root radius necessitated that these serve as minimal estimates for intracellular Al. Total accumulation of intracellular Al for each region was 60, 73, and 210 nmol g-1 fresh weight after 4 h, increasing with root development. Early metabolic responses to external Al, including those that have been reported deep inside the root and in mature regions, might result directly from intracellular Al. These responses might include ion transport events at the endodermis of mature roots or events associated with lateral root emergence, as well as events within the root tip.

Enhancement of the secondary ion emission from Si by O/sub 2 and H/sub 2/O adsorption

International Nuclear Information System (INIS)

Huan, C.H.; Wee, A.T.S.; Tan, K.L.

1992-01-01

The positive and negative secondary ion emission of Si are examined as a function of O/sub 2 and H/sub 2/O surface coverage under conditions of simultaneous adsorption and Ar/sup+ ion bombardment. It is found that the ion-molecule mechanism accounts for the adsorbate-induced signals and that yield enhancement by H/sub 2/O adsorption is less effective than O/sub 2 adsorption. (authors)

Investigation of chemical changes in uranium oxyfluoride particles using secondary ion mass spectrometry

International Nuclear Information System (INIS)

Kips, R.S.; Kristo, M.J.

2009-01-01

Understanding how environmental conditions may affect sample composition is critical to the interpretation of laboratory analyses from environmental sampling. We prepared a set of UO 2 F 2 particle samples from the hydrolysis of UF 6 and stored these samples in environmental chambers at different temperature, humidity and lighting conditions. The NanoSIMS ion microprobe was used to measure the UF + /U + secondary ion ratio of individual particles. Monitoring variations in this ratio may provide insights on changes in particle composition over time and in response to environmental exposure. This report presents the baseline measurements carried out on freshly-prepared particle samples to determine the initial amount of fluorine. (author)

Ion implantation artifacts observed in depth profiling boron in silicon by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Chi, P.; Simons, D.S.

1987-01-01

A comparison study of depth profiling by secondary ion mass spectrometry (SIMS) and neutron depth profiling (NDP) was recently conducted. The specimens were portions of 5 cm diameter single crystal silicon slices in which B-10 had been implanted at various fluences and energies. NDP measurements were made on a 13 mm diameter area at the center of the wafers. SIMS measurements were taken from a 60 μm diameter area approximately 16 mm from the center of the wafer. One observation that emerged from this work was an apparent discrepancy between the profiles of B-10 measured by DNP and SIMS. The peaks of the SIMS profiles were typically deeper than those of NDP by as much as 30 nm, which is 10% of the projected range for a 70 keV implant. Moreover, the profiles could not be made to coincide by either a constant shift or a proportional change of one depth scale with respect to the other. The lateral inhomogeneity of boron that these experiments have demonstrated arises from the variable contribution of ion channeling during implantation

Analysis of intensities of positive and negative ion species from silicon dioxide films using time-of-flight secondary ion mass spectrometry and electronegativity of fragments

International Nuclear Information System (INIS)

Chiba, Kiyoshi

2010-01-01

Intensities of positive and negative ion species emitted from thermally oxidized and plasma-enhanced chemical vapor deposited (PECVD) SiO 2 films were analyzed using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and the Saha-Boltzmann equation. Intensities of positive and negative secondary ion species were normalized to those of 28 Si + and 28 Si - ions, respectively, and an effective temperature of approximately (7.2 ± 0.1) x 10 3 K of the sputtered region bombarded with pulsed 22 kV Au 3 + primary ions was determined. Intensity spectra showed polarity dependence on both n and m values of Si n O m fragments, and a slight shift to negative polarity for PECVD SiO 2 compared to thermally oxidized SiO 2 films. By dividing the intensity ratios of negative-to-positive ions for PECVD SiO 2 by those for thermally oxidized SiO 2 films to cancel statistical factors, the difference in absolute electronegativity (half the sum of ionization potential and electron affinity of fragments) between both films was obtained. An increase in electronegativity for SiO m (m = 1, 2) and Si 2 O m (m = 1-4) fragments for PECVD SiO 2 films compared to thermally oxidized films was obtained to be 0.1-0.2 Pauling units, indicating a more covalent nature of Si-O bonds for PECVD SiO 2 films compared to the thermally oxidized SiO 2 films.

An RF ion source based primary ion gun for secondary ion mass spectroscopy

International Nuclear Information System (INIS)

Menon, Ranjini; Nabhiraj, P.Y.; Bhandari, R.K.

2011-01-01

In this article we present the design, development and characterization of an RF plasma based ion gun as a primary ion gun for SIMS application. RF ion sources, in particular Inductively Coupled Plasma (ICP) ion sources are superior compared to LMIS and duoplasmtron ion sources since they are filamentless, can produce ions of gaseous elements. At the same time, ICP ion sources offer high angular current density which is an important factor in producing high current in small spot size on the target. These high current microprobes improve the signal to noise ratio by three orders as compared to low current ion sources such as LMIS. In addition, the high current microprobes have higher surface and depth profiling speeds. In this article we describe a simple ion source in its very basic form, two lens optical column and characteristics of microprobe

Secondary ion shadow-cone enhanced desorption

Energy Technology Data Exchange (ETDEWEB)

Chechen Chang (Hawaii Univ., Honolulu (USA). Dept. of Chemistry)

1990-02-01

The incident angle dependence of the secondary particle emission process under keV ion bombardment has been investigated. The results from the full molecular dynamics calculations indicate that the flux anisotropy of the incident beam, resulting from the non-uniform impact parameters for the surface atom of a single crystal, affects the particle desorption in a systematic fashion. The enhanced desorption at certain angles of incidence corresponds to the intensive focusing of the incident beam to the near-surface atom and the extended dissipation of momentum by large-angle scattering. This observation has let us to develop a new theoretical model in which the enhanced desorption is described by the distance of closest encounter along the trajectory of the incident particle to the surface atom. The computer time for the simulation of the incident-angle-dependent emission process is significantly reduced. The results from the calculation based on this model are in good agreement both with the results from the full dynamics calculation and with the experimental results. The new model also allows a complementary evaluation of the microscopic dynamics involved in the shadow-cone enhanced desorption. (author).

Total Quality Management in Secondary Schools in Kenya: Extent of Practice

Science.gov (United States)

Ngware, Moses Waithanji; Wamukuru, David Kuria; Odebero, Stephen Onyango

2006-01-01

Purpose: To investigate the extent to which secondary schools practiced aspects of total quality management (TQM). Design/methodology/approach: A cross-sectional research design was used in this study. A sample of 300 teachers in a residential session during a school holiday provided their perceptions on the practice of TQM in their schools. Data…

Alpha spectrometry and the secondary ion mass spectrometry of thorium

International Nuclear Information System (INIS)

Strisovska, J.; Kuruc, J.; Galanda, D.; Matel, L.; Aranyosiova, M.; Velic, D.

2009-01-01

The main objective of this master thesis was preparation of samples with thorium content on the steel discs by electrodeposition for determination of natural thorium isotope by alpha spectrometry and the secondary ion mass spectrometry and finding out their possible linear correlation between these methods. The samples with electrolytically excluded isotope of 232 Th were prepared by electrodeposition from solution Th(NO 3 ) 4 ·12 H2 O on steel discs in electrodeposition cell with use of solutions Na 2 SO 4 , NaHSO 4 , KOH and (NH 4 ) 2 (C 2 O 4 ) by electric current 0.75 A. Discs were measured by alpha spectrometer. Activity was calculated from the registered impulses for 232 Th and surface's weight. After alpha spectrometry measurements discs were analyzed by TOF-SIMS IV which is installed in the International Laser Centre in Bratislava. Intensities of isotope of 232 Th and ions of ThO + , ThOH + , ThO 2 H + , Th 2 O 4 H + , ThO 2 - , ThO 3 H - , ThH 3 O 3 - and ThN 2 O 5 H - were identified. The linear correlation is between surface's weights of Th and intensities of ions of Th + from SIMS, however the correlation coefficient has relatively low value. We found out with SIMS method that oxidized and hydride forms of thorium are significantly represented in samples with electroplated thorium. (authors)

Time‐of‐flight secondary ion mass spectrometry imaging of biological samples with delayed extraction for high mass and high spatial resolutions

Science.gov (United States)

Vanbellingen, Quentin P.; Elie, Nicolas; Eller, Michael J.; Della‐Negra, Serge; Touboul, David

2015-01-01

Rationale In Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS), pulsed and focused primary ion beams enable mass spectrometry imaging, a method which is particularly useful to map various small molecules such as lipids at the surface of biological samples. When using TOF‐SIMS instruments, the focusing modes of the primary ion beam delivered by liquid metal ion guns can provide either a mass resolution of several thousand or a sub‐µm lateral resolution, but the combination of both is generally not possible. Methods With a TOF‐SIMS setup, a delayed extraction applied to secondary ions has been studied extensively on rat cerebellum sections in order to compensate for the effect of long primary ion bunches. Results The use of a delayed extraction has been proven to be an efficient solution leading to unique features, i.e. a mass resolution up to 10000 at m/z 385.4 combined with a lateral resolution of about 400 nm. Simulations of ion trajectories confirm the experimental determination of optimal delayed extraction and allow understanding of the behavior of ions as a function of their mass‐to‐charge ratio. Conclusions Although the use of a delayed extraction has been well known for many years and is very popular in MALDI, it is much less used in TOF‐SIMS. Its full characterization now enables secondary ion images to be recorded in a single run with a submicron spatial resolution and with a mass resolution of several thousand. This improvement is very useful when analyzing lipids on tissue sections, or rare, precious, or very small size samples. © 2015 The Authors. Rapid Communications in Mass Spectrometry published by John Wiley & Sons Ltd. PMID:26395603

Implementation of a secondary-ion tritium beam by means of the associated particle technique and its test on a gold target

Energy Technology Data Exchange (ETDEWEB)

Policroniades, R.; Fernández-Arnáiz, J.; Murillo, G.; Moreno, E.; Villaseñor, P.; Méndez, B. [Departamento de Aceleradores, Instituto Nacional de Investigaciones Nucleares, Carr. México-Toluca S/N, Ocoyoacac, Estado de México 52750 (Mexico); Chávez, E.; Ortíz-Salazar, M.E.; Huerta, A. [Instituto de Física, Universidad Nacional Autónoma de México, A.P. 20-364, México, D.F. 01000 (Mexico); Varela-González, A. [Centro de Ciencias de la Atmósfera, Universidad Nacional Autónoma de México, A.P. 20-364, México, D.F. 01000 (Mexico)

2014-05-21

In this work we present the implementation and characterization of a (secondary ion) tritium beam generated through the D(d,t)p reaction, at deuteron energies of 2.0 and 1.88 MeV, tagging the tritium ions with the associated particle technique. In order to prove its utility as a projectile for scientific applications, this beam was made to impinge on a thin gold target to observe expected elastic scattering events. - Highlights: • A new secondary ion tritium beam obtained through the D(d,t)3He reaction. • Tritium beam tagging by the associated particle technique. • A low energy Tritium beam without radiation contamination of equipment. • Tritium elastic scattering on gold.

Implementation of a secondary-ion tritium beam by means of the associated particle technique and its test on a gold target

International Nuclear Information System (INIS)

Policroniades, R.; Fernández-Arnáiz, J.; Murillo, G.; Moreno, E.; Villaseñor, P.; Méndez, B.; Chávez, E.; Ortíz-Salazar, M.E.; Huerta, A.; Varela-González, A.

2014-01-01

In this work we present the implementation and characterization of a (secondary ion) tritium beam generated through the D(d,t)p reaction, at deuteron energies of 2.0 and 1.88 MeV, tagging the tritium ions with the associated particle technique. In order to prove its utility as a projectile for scientific applications, this beam was made to impinge on a thin gold target to observe expected elastic scattering events. - Highlights: • A new secondary ion tritium beam obtained through the D(d,t)3He reaction. • Tritium beam tagging by the associated particle technique. • A low energy Tritium beam without radiation contamination of equipment. • Tritium elastic scattering on gold

Secondary electron emission from Au by medium energy atomic and molecular ions

CERN Document Server

Itoh, A; Obata, F; Hamamoto, Y; Yogo, A

2002-01-01

Number distributions of secondary electrons emitted from a Au metal surface have been measured for atomic and molecular ions of H sup + , He sup + , C sup + , N sup + , O sup + , H sup + sub 2 , H sup + sub 3 , HeH sup + , CO sup + and O sup + sub 2 in the energy range 0.3-2.0 MeV. The emission statistics obtained are described fairly well by a Polya function. The Polya parameter b, determining the distribution shape, is found to decrease monotonously with increasing emission yield gamma, revealing a surprising relationship of b gamma approx 1 over the different projectile species and impact energies. This finding supports certainly the electron cascading model. Also we find a strong negative molecular effect for heavier molecular ions, showing a significant reduction of gamma compared to the estimated values using constituent atomic projectile data.

Secondary ion emission from cleaned surfaces bombarded by 100 MeV accelerator beams at the GSI Darmstadt

International Nuclear Information System (INIS)

Wien, K.; Becker, O.; Guthier, W.; Knippelberg, W.; Koczon, P.

1988-01-01

The 1.4 MeV/n beam facility for the UNILAC/GSI has been used to study secondary ion emission from surfaces cleaned under UHV conditions by ion etching or cleaving of crystals. The desorption phenomena observed by means of TOF mass spectrometry can be classified as follows: (1) Clean metal surfaces emit metal ions being ejected by atomic collisions cascades. Electronic excitation of surface states seems to support ionization. (2) The desorption of contaminants adsorbed at the metal surface is strongly correlated with the electronic energy loss of the projectiles - even, if the content of impurities is very low. (3) Ion formation at the epitaxial surface of fluoride crystals as CaF 2 , MgF 2 and NaF is initiated by the electronic excitation of the crystal. At high beam energies the mass spectrum is dominated by a series of cluster ions. These cluster ions disappear below a certain energy deposit threshold, whereas small atomic ions are observed over the whole energy range

Determination of isotopic composition of uranium in microparticles by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Veniaminov, N.N.; Kolesnikov, O.N.; Stebel'kov, V.A.

1992-01-01

Aerosol particles including uranium in their composition are specific atmospheric polutants. Uranium is used as nuclear fuel in atomic power stations and in spacecraft power units, and also as a component of nuclear warheads. In order to monitor the discharge of uranium-containing aerosol particles to the atmosphere, they must first be identified. As an example, one may cite an investigation of the elemental composition and radioactivity of particles formed in the accident at the Chernobyl atomic power station. One of the most informative indicators of the origin of uranium-containing aerosol particles is the isotopic composition of the uranium. Secondary ion mass spectrometry (SIMS) offers unique possibilities for the measurement of isotope ratios in individual microscopic objects. At the same time, a measurement of isotope ratios of sulfur in microsection of galenite PbS 2 has shown that the application of SIMS for these purposes is seriously limited by the difference in yield of secondary ions for isotopes with different masses. These discrimination effects, in the case of light elements such as boron, may result in distortion of the isotope ratios by several percent. In the case of heavy elements, however, the effect is less significant, amounting to about 0.5% for lead isotopes. 13 refs., 3 figs., 1 tab

Ranges, Reflection and Secondary Electron Emission for keV Hydrogen Ions Incident on Solid N2

DEFF Research Database (Denmark)

Børgesen, P.; Sørensen, H.; Hao-Ming, Chen

1983-01-01

Ranges were measured for 0.67–3.3 keV/amu hydrogen and deuterium ions in solid N2. Comparisons with similar results for N2-gas confirm the previously observed large phase effect in the stopping cross section. Measurements of the secondary electron emission coefficient for bulk solid N2 bombarded...... by 0.67–9 keV/amu ions also seem to support such a phase effect. It is argued that we may also extract information about the charge state of reflected projectiles....

Identity confirmation of drugs and explosives in ion mobility spectrometry using a secondary drift gas.

Science.gov (United States)

Kanu, Abu B; Hill, Herbert H

2007-10-15

This work demonstrated the potential of using a secondary drift gas of differing polarizability from the primary drift gas for confirmation of a positive response for drugs or explosives by ion mobility spectrometry (IMS). The gas phase mobilities of response ions for selected drugs and explosives were measured in four drift gases. The drift gases chosen for this study were air, nitrogen, carbon dioxide and nitrous oxide providing a range of polarizability and molecular weights. Four other drift gases (helium, neon, argon and sulfur hexafluoride) were also investigated but design limitations of the commercial instrument prevented their use for this application. When ion mobility was plotted against drift gas polarizability, the resulting slopes were often unique for individual ions, indicating that selectivity factors between any two analytes varied with the choice of drift gas. In some cases, drugs like THC and heroin, which are unresolved in air or nitrogen, were well resolved in carbon dioxide or nitrous oxide.

HANARO secondary coolant management

International Nuclear Information System (INIS)

Kim, Seon Duk.

1998-02-01

In this report, the basic theory for management of water quality, environmental factors influencing to the coolant, chemicals and its usage for quality control of coolant are mentioned, and water balance including the loss rate by evaporation (34.3 m 3 /hr), discharge rate (12.665 m 3 /hr), concentration ratio and feed rate (54.1 m 3 /hr) are calculated at 20 MW operation. Also, the analysis data of HANSU Limited for HANARO secondary coolant (feed water and circulating coolant) - turbidity, pH, conductivity, M-alkalinity, Ca-hardness, chloride ion, total iron ion, phosphoric ion and conversion rate are reviewed. It is confirmed that the feed water has good quality and the circulating coolant has been maintained within the control specification in general, but some items exceeded the control specification occasionally. Therefore it is judged that more regular discharge of coolant is needed. (author). 6 refs., 17 tabs., 18 figs

High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

International Nuclear Information System (INIS)

Wirtz, T; Philipp, P; Audinot, J-N; Dowsett, D; Eswara, S

2015-01-01

Secondary ion mass spectrometry (SIMS) constitutes an extremely sensitive technique for imaging surfaces in 2D and 3D. Apart from its excellent sensitivity and high lateral resolution (50 nm on state-of-the-art SIMS instruments), advantages of SIMS include high dynamic range and the ability to differentiate between isotopes. This paper first reviews the underlying principles of SIMS as well as the performance and applications of 2D and 3D SIMS elemental imaging. The prospects for further improving the capabilities of SIMS imaging are discussed. The lateral resolution in SIMS imaging when using the microprobe mode is limited by (i) the ion probe size, which is dependent on the brightness of the primary ion source, the quality of the optics of the primary ion column and the electric fields in the near sample region used to extract secondary ions; (ii) the sensitivity of the analysis as a reasonable secondary ion signal, which must be detected from very tiny voxel sizes and thus from a very limited number of sputtered atoms; and (iii) the physical dimensions of the collision cascade determining the origin of the sputtered ions with respect to the impact site of the incident primary ion probe. One interesting prospect is the use of SIMS-based correlative microscopy. In this approach SIMS is combined with various high-resolution microscopy techniques, so that elemental/chemical information at the highest sensitivity can be obtained with SIMS, while excellent spatial resolution is provided by overlaying the SIMS images with high-resolution images obtained by these microscopy techniques. Examples of this approach are given by presenting in situ combinations of SIMS with transmission electron microscopy (TEM), helium ion microscopy (HIM) and scanning probe microscopy (SPM). (paper)

Time-of-flight secondary ion mass spectrometry of polymer surfaces

International Nuclear Information System (INIS)

Leeson, A.M.

1997-09-01

The effects of polymer variables (molecular weight, polydispersity, and tacticity) and sample preparation parameters (film thickness and casting solvent) on ToF SIMS spectra were studied using a series of polymethyl methacrylate (PMMA) and polybutyl methacrylate (PBMA) standards. The polymers were extensively characterized by a variety of spectroscopic and chromatographic techniques. Films were prepared by solution casting and spin casting methods onto aluminium substrates, which were evaluated by x-ray photoelectron spectroscopy (XPS). These films were characterized by high- and unit-mass resolution ToF SIMS. To determine the level of spectral repeatability standard errors were calculated using three methods of data analysis (absolute intensity (counts), normalised peak intensities (NPIs), and ion intensity ratios). Molecular weight and film thickness had the greatest influence on the SIMS spectra of PMMA, with the differences being most marked at low molecular weight. This was observed in both total negative ion counts and negative ion intensity ratios. An explanation based on the surface concentration of polymer end groups is presented. From these results an extension to the existing mechanisms of ion formation is postulated, which includes end group cleavage. An ion beam damage study of PMMA showed that molecular weight and film thickness affect negative ion spectra. Extended 'surface lifetime' was seen in thin (spun cast) films when compared to thick (solution cast) films. This effect, which was only observed with 'Low' PMMA, was explained in terms of surface chain mobility. The effect of molecular weight was dramatic and an explanation in terms of different origins of diagnostic ions is presented. Molecular weight affected the SIMS spectra of PBMA. However, it was not possible to draw definitive conclusions, because the end groups in three of the samples were not known. (author)

Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool

International Nuclear Information System (INIS)

Smentkowski, Vincent S.; Ostrowski, Sara G.

2007-01-01

Combinatorial materials libraries are becoming more complicated; successful screening of these libraries requires the development of new high throughput screening methodologies. Time of flight secondary ion mass spectrometry (ToF-SIMS) is a surface analytical technique that is able to detect and image all elements (including hydrogen which is problematic for many other analysis instruments) and molecular fragments, with high mass resolution, during a single measurement. Commercial ToF-SIMS instruments can image 500 μm areas by rastering the primary ion beam over the region of interest. In this work, we will show that large area analysis can be performed, in one single measurement, by rastering the sample under the ion beam. We show that an entire 70 mm diameter wafer can be imaged in less than 90 min using ToF-SIMS stage (macro)rastering techniques. ToF-SIMS data sets contain a wealth of information since an entire high mass resolution mass spectrum is saved at each pixel in an ion image. Multivariate statistical analysis (MVSA) tools are being used in the ToF-SIMS community to assist with data interpretation; we will demonstrate that MVSA tools provide details that were not obtained using manual (univariate) analysis

Individual analysis of nonmetallic Inclusions in Steel by using the gallium focused ion beam secondary ion mass spectrometry

International Nuclear Information System (INIS)

Tomiyasu, Bunbunoshin; Inami, Akihiro; Abe, Masakazu; Nihei, Yoshimasa.

1995-01-01

Nonmetallic inclusions frequently exert a lot of unfavorable influences on the quality of steel. The size of nonmetallic inclusions in current steel products is less than a few μm in diameter. It is desirable to make clear the origin and generation process of such small particles of nonmetallic inclusion. In order to measure the shape, size, composition and inner elemental distribution, development of characterization methods for each inclusion particle is required. By employing a gallium focused ion beam (FIB) as a primary ion beam of secondary ion mass spectrometry (SIMS), the particle analysis with high spatial resolution is easily achieved. In this paper, we present the novel individual analysis of nonmetallic inclusions in steel by gallium FIB SIMS. We analyzed in two ways the nonmetallic inclusion particles segregated by electron beam melting. (1) By cross-sectioning of the particle using a gallium FIB, elemental maps of cross-section were obtained. The elements were distributed inhomogeneously on the cross-section. (2) We carried out the compositional analysis for several particles individually. Ten particles were analyzed by the shave-off analysis and the multivariate cluster analysis. Based on the composition of each particle, the inclusions were classified into six types. (author)

Diffusion of iron in lithium niobate: a secondary ion mass spectrometry study

Energy Technology Data Exchange (ETDEWEB)

Ciampolillo, M.V.; Argiolas, N.; Zaltron, A.; Bazzan, M.; Sada, C. [University of Padova, Physics Department (Italy); CNISM, Padova (Italy)

2011-10-15

Iron-doped X-cut lithium niobate crystals were prepared by means of thermal diffusion from thin film varying in a systematic way the process parameters such as temperature and diffusion duration. Secondary Ion Mass Spectrometry was exploited to characterize the iron in-depth profiles. The evolution of the composition of the Fe thin film in the range between 600 C and 800 C was studied, and the diffusion coefficient at different temperatures in the range between 900 C and 1050 C and the activation energy of the diffusion process were estimated. (orig.)

Challenges to Successful Total Quality Management Implementation in Public Secondary Schools: A Case Study of Kohat District, Pakistan

Science.gov (United States)

Suleman, Qaiser; Gul, Rizwana

2015-01-01

The current study explores the challenges faced by public secondary schools in successful implementation of total quality management (TQM) in Kohat District. A sample of 25 heads and 75 secondary school teachers selected from 25 public secondary schools through simple random sampling technique was used. Descriptive research designed was used and a…

Nuclear Forensics: Measurements of Uranium Oxides Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Science.gov (United States)

2010-03-01

Isotope Ratio Analysis of Actinides , Fission Products, and Geolocators by High- efficiency Multi-collector Thermal Ionization Mass Spectrometry...Information, 1999. Hou, Xiaolin, and Per Roos. “ Critical Comparison of radiometric and Mass Spectrometric Methods for the Determination of...NUCLEAR FORENSICS: MEASUREMENTS OF URANIUM OXIDES USING TIME-OF-FLIGHT SECONDARY ION MASS

Anthropogenic Influence on Secondary Aerosol Formation and Total Water-Soluble Carbon on Atmospheric Particles

Science.gov (United States)

Gioda, Adriana; Mateus, Vinicius; Monteiro, Isabela; Taira, Fabio; Esteves, Veronica; Saint'Pierre, Tatiana

2013-04-01

On a global scale, the atmosphere is an important source of nutrients, as well as pollutants, because of its interfaces with soil and water. Important compounds in the gaseous phase are in both organic and inorganic forms, such as organic acids, nitrogen, sulfur and chloride. In spite of the species in gas form, a huge number of process, anthropogenic and natural, are able to form aerosols, which may be transported over long distances. Sulfates e nitrates are responsible for rain acidity; they may also increase the solubility of organic compounds and metals making them more bioavailable, and also can act as cloud condensation nuclei (CCN). Aerosol samples (PM2.5) were collected in a rural and industrial area in Rio de Janeiro, Brazil, in order to quantify chemical species and evaluate anthropogenic influences in secondary aerosol formation and organic compounds. Samples were collected during 24 h every six days using a high-volume sampler from August 2010 to July 2011. The aerosol mass was determined by Gravimetry. The water-soluble ionic composition (WSIC) was obtained by Ion Chromatography in order to determine the major anions (NO3-, SO4= and Cl-); total water-soluble carbon (TWSC) was determined by a TOC analyzer. The average aerosol (PM2.5) concentrations ranged from 1 to 43 ug/m3 in the industrial site and from 4 to 35 ug/m3 in the rural area. Regarding anions, the highest concentrations were measured for SO42- (10.6 μg/m3-12.6 μg/m3); where the lowest value was found in the rural site and the highest in the industrial. The concentrations for NO3- and Cl- ranged from 4.2 μg/m3 to 9.3 μg/m3 and 3.1 μg/m3 to 6.4 μg /m3, respectively. Sulfate was the major species and, like nitrate, it is related to photooxidation in the atmosphere. Interestingly sulfate concentrations were higher during the dry period and could be related to photochemistry activity. The correlations between nitrate and non-sea-salt sulfate were weak, suggesting different sources for these

Secondary emission ion analyzer provided with an electron gun for insulating material analysis

International Nuclear Information System (INIS)

Blanchard, Bruno; Carrier, Patrick; Marguerite, J.-L.; Rocco, J.-C.

1976-01-01

This invention relates to a secondary emission ion analyser, fitted with an electron gun. It is used in the mass spectrometry analysis of electrically insulating bodies. It has already been suggested to bombard the target with an electron beam in conjunction with the beam of primary particles, in order to reduce the space charge near the target. The object of this invention is the application of this known process to appliances of the ion analyser type with a high electric field near the target. Its main characteristic is the use of an electron gun emitting an electron beam through the extraction lens placed opposite the target. The extraction electric field influences the path of the electrons but the electric and mechanical specifications of the electron gun in the invention are such that the target is correctly sprayed by the electron beam [fr

Ion-Scale Secondary Flux Ropes Generated by Magnetopause Reconnection as Resolved by MMS

Science.gov (United States)

Eastwood, J. P.; Phan, T. D.; Cassak, P. A.; Gershman, D. J.; Haggerty, C.; Malakit, K.; Shay, M. A.; Mistry, R.; Oieroset, M.; Russell, C. T.;

Effect of calcium oxide on the efficiency of ferrous ion oxidation and total iron precipitation during ferrous ion oxidation in simulated acid mine drainage treatment with inoculation of Acidithiobacillus ferrooxidans.

Science.gov (United States)

Liu, Fenwu; Zhou, Jun; Jin, Tongjun; Zhang, Shasha; Liu, Lanlan

2016-01-01

Calcium oxide was added into ferrous ion oxidation system in the presence of Acidithiobacillus ferrooxidans at concentrations of 0-4.00 g/L. The pH, ferrous ion oxidation efficiency, total iron precipitation efficiency, and phase of the solid minerals harvested from different treatments were investigated during the ferrous ion oxidation process. In control check (CK) system, pH of the solution decreased from 2.81 to 2.25 when ferrous ions achieved complete oxidation after 72 h of Acidithiobacillus ferrooxidans incubation without the addition of calcium oxide, and total iron precipitation efficiency reached 20.2%. Efficiency of ferrous ion oxidation and total iron precipitation was significantly improved when the amount of calcium oxide added was ≤1.33 g/L, and the minerals harvested from systems were mainly a mixture of jarosite and schwertmannite. For example, the ferrous ion oxidation efficiency reached 100% at 60 h and total iron precipitation efficiency was increased to 32.1% at 72 h when 1.33 g/L of calcium oxide was added. However, ferrous ion oxidation and total iron precipitation for jarosite and schwertmannite formation were inhibited if the amount of calcium oxide added was above 2.67 g/L, and large amounts of calcium sulfate dihydrate were generated in systems.

Effect of the track potential on the motion and energy flow of secondary electrons created from heavy-ion irradiation

Science.gov (United States)

Moribayashi, Kengo

2018-05-01

Using simulations, we have evaluated the effect of the track potential on the motion and energy flow of secondary electrons, with the goal of determining the spatial distribution of energy deposition due to irradiation with heavy ions. We have simulated this effect as a function of the mean path τ between the incident ion-impact-ionization events at ion energies Eion. Here, the track potential is the potential formed from electric field near this incident ion path. The simulations indicate that this effect is mainly determined by τ and hardly depends on Eion. To understand heavy ion beam science more deeply and to reduce the time required by simulations, we have proposed simple approximation methods that almost reproduce the simulation results here.

Effect of TOC [total organic carbon] on a PWR secondary cooling water system

International Nuclear Information System (INIS)

Gau, J.Y.; Oung, J.C.; Wang, T.Y.

1989-01-01

Increasing the amount of total organic carbon (TOC) during the wet layup of the steam generator was a problem in PWR nuclear power plant in Taiwan. The results of surveys of TOC in PWR secondary cooling water systems had shown that the impurity of hydrazine and the bacteria were the main reasons that increase TOC. These do not have a corrosion effect on Inconel 600 and carbon steel when the secondary cooling water containing the TOC is below 200 ppb. But the anaerobic bacteria from the steam generator in wet layup will increase corrosion rate of carbon steel and crevice corrosion of Inconel 600. (author)

Relativistic total energy and chemical potential of heavy atoms and positive ions

International Nuclear Information System (INIS)

Hill, S.H.; Grout, P.J.; March, N.H.

1984-01-01

The relativistic Thomas-Fermi theory, with a finite nucleus, is used to study the variation of the chemical potential μ with atomic number Z and number of electrons N (N <= Z). The difference between the total energy of positive ions and that of the corresponding neutral atom has been obtained. The scaling predictions are confirmed by numerical calculations. The first principles calculation of the relativistic Thomas-Fermi total energy of neutral atoms is also studied. (author)

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

OpenAIRE

G. Fubiani; H. P. L. de Esch; A. Simonin; R. S. Hemsworth

2008-01-01

The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER) is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses). The resulting seco...

Static secondary ion mass spectrometry for organic and inorganic molecular analysis in solids

International Nuclear Information System (INIS)

Ham, Rita van; Vaeck, Luc van; Adriaens, Annemie; Adams, Freddy

2003-01-01

The use of mass spectra in secondary ion mass spectrometry (S-SIMS) to characterise the molecular composition of inorganic and organic analytes at the surface of solid samples is investigated. Methodological aspects such as mass resolution, mass accuracy, precision and accuracy of isotope abundance measurements, influence of electron flooding and sample morphology are addressed to assess the possibilities and limitations that the methodology can offer to support the structural assignment of the detected ions. The in-sample and between-sample reproducibility of relative peak intensities under optimised conditions is within 10%, but experimental conditions and local hydration, oxidation or contamination can drastically affect the mass spectra. As a result, the use of fingerprinting for identification becomes compromised. Therefore, the preferred way of interpretation becomes the deductive structural approach, based on the use of the empirical desorption-ionisation model. This approach is shown to allow the molecular composition of inorganic and organic components at the surface of solids to be characterised. Examples of inorganic speciation and identification of organic additives with unknown composition in inorganic salt mixtures are given. The methodology is discussed in terms of foreseen developments with respect to the use of polyatomic primary ions

Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometry

International Nuclear Information System (INIS)

Borchardt, G.; Scherrer, H.; Weber, S.; Scherrer, S.

1980-01-01

Local microanalysis of non-conducting surfaces by means of modern physical methods which use charged low-energy primary particles brings about severe problems because of the electrostatic charge accumulated on the sample surface. This is also true of secondary ion mass spectrometry (SIMS) where ions are usually used as primary particles. In the present work the basic features for production of neutral primary beams in commercial SIMS instruments by a simple technique are described. With suitably high sputtering rates, surface analyses and in-depth profiles can be made in reasonable measuring times. Results are given for chemical concentration distributions in the near-surface regions of an oxide glass and for the isotopic diffusion of Si-30 in a crystalline silicate with olivine structure (Co 2 SiO 4 ). (orig.)

Secondary coolant purification system

International Nuclear Information System (INIS)

Stiteler, F.Z.; Donohue, J.P.

1978-01-01

The present invention combines the attributes of volatile chemical addition, continuous blowdown, and full flow condensate demineralization. During normal plant operation (defined as no primary to secondary leakage) condensate from the condenser is pumped through a full flow condensate demineralizer system by the condensate pumps. Volatile chemical additions are made. Dissolved and suspended solids are removed in the condensate polishers by ion exchange and/or filtration. At the same time a continuous blowdown of approximately 1 percent of the main steaming rate of the steam generators is maintained. Radiation detectors monitor the secondary coolant. If these monitors indicate no primary to secondary leakage, the blowdown is cooled and returned directly to the condensate pump discharge. If one of the radiation monitors should indicate a primary to secondary leak, when the temperature of the effluent exiting from the blowdown heat exchanger is compatible with the resin specifications of the ion exchangers, the bypass valve causes the blowdown flow to pass through the blowdown ion exchangers

A novel electrostatic ion-energy spectrometer by the use of a proposed ``self-collection'' method for secondary-electron emission from a metal collector

Science.gov (United States)

Hirata, M.; Nagashima, S.; Cho, T.; Kohagura, J.; Yoshida, M.; Ito, H.; Numakura, T.; Minami, R.; Kondoh, T.; Nakashima, Y.; Yatsu, K.; Miyoshi, S.

2003-03-01

For the purpose of end-loss-ion energy analyses in open-field plasmas, a newly developed electrostatic ion-energy spectrometer is proposed on the basis of a "self-collection" principle for secondary-electron emission from a metal collector. The ion-energy spectrometer is designed with multiple grids for analyzing incident ion energies, and a set of parallelly placed metal plates with respect to lines of ambient magnetic forces in an open-ended device. One of the most important characteristic properties of this spectrometer is the use of our proposed principle of a "self-collection" mechanism due to E×B drifts for secondary electrons emitted from the grounded metal-plate collector by the use of no further additional magnetic systems except the ambient open-ended fields B. The proof-of-principle and characterization experiments are carried out by the use of a test-ion-beam line along with an additional use of a Helmholtz coil system for the formation of open magnetic fields similar to those in the GAMMA 10 end region. The applications of the developed ion-energy spectrometer for end-loss-ion diagnostics in the GAMMA 10 plasma experiments are demonstrated under the conditions with simultaneous incidence of energetic electrons produced by electron-cyclotron heatings for end-loss-plugging potential formation, since these electrons have contributed to disturb these ion signals from conventional end-loss-ion detectors.

Wave packet study of the secondary emission of negatively charged, monoatomic ions from sputtered metals

Energy Technology Data Exchange (ETDEWEB)

Sindona, A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy) and Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)]. E-mail: sindona@fis.unical.it; Riccardi, P. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Maletta, S. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Rudi, S.A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Falcone, G. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)

2007-05-15

Secondary emission of Ag{sup -} and Au{sup -} particles, following the sputtering of clean Ag(1 0 0) and Au(1 0 0) targets, respectively, is studied with a Crank-Nicholson wave-packet propagation method. A one-electron pseudo-potential is used to describe the plane metal surface, with a projected band gap, the ejected ion, whose charge state is investigated, and its nearest-neighbor substrate ion, put in motion by the collision cascade generated by the primary ion beam. Time-dependent Schroedinger equation is solved backwards in time to determine the evolution of the affinity orbital of the negative particles from an instant when they are unperturbed, at distances of the order of {approx}10{sup 2} a.u. from the surface, to the instant of ejection. The probability that a band electron will be eventually detected in affinity state of the ejected particle is, thus, calculated and compared with the result of another method based on the spectral decomposition of the one-electron Hamiltonian.

Organic secondary ion mass spectrometry: sensitivity enhancement by gold deposition.

Science.gov (United States)

Delcorte, A; Médard, N; Bertrand, P

2002-10-01

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been covered with 2-60 nmol of gold/cm2 in order to enhance the ionization efficiency for static secondary ion mass spectrometry (s-SIMS) measurements. Au-cationized molecules (up to -3,000 Da) and fragments (up to the trimer) are observed in the positive mass spectra of metallized polystyrene (PS) oligomer films. Beyond 3,000 Da, the entanglement of polymer chains prevents the ejection of intact molecules from a "thick" organic film. This mass limit can be overcome by embedding the polymer chains in a low-molecular-weight matix. The diffusion of organic molecules over the metal surfaces is also demonstrated for short PS oligomers. In the case of high-molecular-weight polymers (polyethylene, polypropylene, PS) and polymer additives (Irganox 1010, Irgafos 168), the metallization procedure induces a dramatic increase of the fingerprint fragment ion yields as well as the formation of new Aucationized species that can be used for chemical diagnostics. In comparison with the deposition of submonolayers of organic molecules on metallic surfaces, metal evaporation onto organic samples provides a comparable sensitivity enhancement. The distinct advantage of the metal evaporation procedure is that it can be used for any kind of organic sample, irrespective of thickness, opening new perspectives for "real world" sample analysis and chemical imaging by s-SIMS.

Probing thin over layers with variable energy/cluster ion beams

International Nuclear Information System (INIS)

Spool, A.; White, R.

2006-01-01

A series of carbon-coated magnetic recording disks proved ideal for exploring sampling depth and ion formation trends as a function of variations in energy and cluster size (Au x ) of the primary ion beam, and variations in over coat thickness and type. Ion yield from the underlying metal layer increased with increasing energy and decreasing cluster size of the primary ions. The yields varied nearly linearly with over layer thickness. In contrast, M x Cs y depth profiles were unaffected by changes in the primary ion. The samples were fortuitously dosed with dinonyl phthalate, allowing a study similar to prior GSIMS work [I.S. Gilmore, M.P. Seah, J.E. Johnstone, in: A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner (Eds.), Proceedings of the 12th International Conference on SIMS, Elsevier, Brussels, 2000, p. 801]. Ions prominent in the EI mass spectrum, including even electron ions, were more consistently enhanced at lower energies and higher cluster sizes than the primary (M + H) + ion. The total secondary ion count was inversely proportional to the film thickness. Secondary electrons, largely originating in the buried metal layer, may be inducing organic ion formation [A.M. Spool, Surf. Interface Anal. 36 (2004) 264

Application of Total Quality Management (TQM) in Secondary School Administration in Umuahia Education Zone

Science.gov (United States)

Ejionueme, L. K.; Oyoyo, Anthonia Oluchi

2015-01-01

The study was conducted to investigate the application of Total Quality Management (TQM) in secondary school administration in Umuahia Education Zone. Three research questions and one null hypothesis guided the study. Descriptive survey design was employed for the study. The population of the study comprised 1365 administrators. Multi-stage…

Characterisation of AGR fuel cladding alloy using secondary ion mass spectrometry

International Nuclear Information System (INIS)

Allen, G.C.; Sparry, R.P.; Wild, R.K.

1987-08-01

Uranium dioxide fuel used in the Advanced Gas Cooled Reactor (AGR) is contained in a ribbed can of 20wt%Cr/25wt%Ni/Nb stabilised steel. Laboratory circumstances, spall during thermal cycling. To date it has been difficult to identify active material originating from the oxidation product of the cladding alloy in the cooling circuit. In an attempt to solve this problem we have set out to characterise fully a sample of oxide from this source and work is in progress to obtain suitable oxide samples from the surface of a 20%Cr/25%Ni/Nb stainless steel. In view of its high sensitivity and the ability to obtain chemical information from relatively small areas we have sought to use Secondary Ion Mass Spectroscopy (SIMS). (author)

Evidence for radical anion formation during liquid secondary ion mass spectrometry analysis of oligonucleotides and synthetic oligomeric analogues: a deconvolution algorithm for molecular ion region clusters.

Science.gov (United States)

Laramée, J A; Arbogast, B; Deinzer, M L

1989-10-01

It is shown that one-electron reduction is a common process that occurs in negative ion liquid secondary ion mass spectrometry (LSIMS) of oligonucleotides and synthetic oligonucleosides and that this process is in competition with proton loss. Deconvolution of the molecular anion cluster reveals contributions from (M-2H).-, (M-H)-, M.-, and (M + H)-. A model based on these ionic species gives excellent agreement with the experimental data. A correlation between the concentration of species arising via one-electron reduction [M.- and (M + H)-] and the electron affinity of the matrix has been demonstrated. The relative intensity of M.- is mass-dependent; this is rationalized on the basis of base-stacking. Base sequence ion formation is theorized to arise from M.- radical anion among other possible pathways.

Direct energy recovery from helium ion beams by a beam direct converter with secondary electron suppressors

International Nuclear Information System (INIS)

Yoshikawa, K.; Yamamoto, Y.; Toku, H.; Kobayashi, A.; Okazaki, T.

1989-01-01

A 5-yr study of beam direct energy conversion was performed at the Kyoto University Institute of Atomic Energy to clarify the essential features of direct energy recovery from monoenergetic ion beams so that the performance characteristics of energy recovery can be predicted reasonably well by numerical calculations. The study used an improved version of an electrostatically electron-suppressed beam direct converter. Secondary electron suppressor grids were added, and a helium ion beam was used with typical parameters of 15.4 keV, 90 mA, and 100 ms. This paper presents a comparison of experimental results with numerical results by the two-dimensional Kyoto University Advanced Dart (KUAD) code, including evaluation of atomic processes

New light on ion channel imaging by total internal reflection fluorescence (TIRF) microscopy.

Science.gov (United States)

Yamamura, Hisao; Suzuki, Yoshiaki; Imaizumi, Yuji

2015-05-01

Ion channels play pivotal roles in a wide variety of cellular functions; therefore, their physiological characteristics, pharmacological responses, and molecular structures have been extensively investigated. However, the mobility of an ion channel itself in the cell membrane has not been examined in as much detail. A total internal reflection fluorescence (TIRF) microscope allows fluorophores to be imaged in a restricted region within an evanescent field of less than 200 nm from the interface of the coverslip and plasma membrane in living cells. Thus the TIRF microscope is useful for selectively visualizing the plasmalemmal surface and subplasmalemmal zone. In this review, we focused on a single-molecule analysis of the dynamic movement of ion channels in the plasma membrane using TIRF microscopy. We also described two single-molecule imaging techniques under TIRF microscopy: fluorescence resonance energy transfer (FRET) for the identification of molecules that interact with ion channels, and subunit counting for the determination of subunit stoichiometry in a functional channel. TIRF imaging can also be used to analyze spatiotemporal Ca(2+) events in the subplasmalemma. Single-molecule analyses of ion channels and localized Ca(2+) signals based on TIRF imaging provide beneficial pharmacological and physiological information concerning the functions of ion channels. Copyright © 2015 The Authors. Production and hosting by Elsevier B.V. All rights reserved.

Self-sputtering runaway in high power impulse magnetron sputtering: The role of secondary electrons and multiply charged metal ions

International Nuclear Information System (INIS)

Anders, Andre

2008-01-01

Self-sputtering runaway in high power impulse magnetron sputtering is closely related to the appearance of multiply charged ions. This conclusion is based on the properties of potential emission of secondary electrons and energy balance considerations. The effect is especially strong for materials whose sputtering yield is marginally greater than unity. The absolute deposition rate increases ∼Q 1/2 , whereas the rate normalized to the average power decreases ∼Q -1/2 , with Q being the mean ion charge state number

Recoil ion spectroscopy with heavy ions

International Nuclear Information System (INIS)

Beyer, H.F.; Mann, R.

1984-01-01

This chapter examines the production of very high charge state ions in single ion-atom collisions. Topics considered include some aspects of highly ionized atoms, experimental approaches, the production of highly charged target ions (monoatomic targets, recoil energy distribution, molecular fragmentation, outer-shell rearrangement, lifetime measurements, a comparison of projectile-, target-, and plasma-ion stripping), and secondary collision experiments (selective electron capture, potential applications). The heavy-ion beams for the described experiments were provided by accelerators such as tandem Van de Graaff facility and the UNILAC

Determination of B and Li in nuclear materials by secondary-ion mass spectrometry

International Nuclear Information System (INIS)

Eby, R.E.; Christie, W.H.

1981-01-01

Secondary ion mass spectrometry (SIMS) was used to perform mass and isotopic analysis for B and Li in samples that are not readily amenable to more conventional mass spectrometric techniques (e.g., surface ionization, electron impact, etc.). In this paper three specific applications of SIMS analysis to nuclear materials are discussed: first, the quantitative determination of B and its isotopic composition in borosilicate glasses; second, the determination of the isotopic composition of B and Li in irradiated nuclear-grade aluminum oxide/boron carbide composite pellets, and, lastly, the quantitative and isotopic determination of B and Li in highly radioactive solutions of unknown composition

Desorption of Cs+ ions with fast incident atomic and molecular ions

International Nuclear Information System (INIS)

Salehpour, M.; Hunt, J.E.; Tou, L.C.; Hedin, A.; Sundqvist, B.

1988-01-01

Preliminary results on desorption yield measurements of secondary Cs + ions, desorbed as a result of the impact of C + , O + , CO + , O 2 + , CO 2 + and C 4 H 9 + incident ions, in the energy range of 950 keV--3.5 MeV are presented. Molecular beams are found to give high yields of secondary Cs + as a result of impact of O 2 + compared to O + incident ions, indicate no ''collective'' molecular effects. 23 refs., 1 fig

Secondary radiation dose during high-energy total body irradiation

Energy Technology Data Exchange (ETDEWEB)

Janiszewska, M.; Raczkowski, M. [Lower Silesian Oncology Center, Medical Physics Department, Wroclaw (Poland); Polaczek-Grelik, K. [University of Silesia, Medical Physics Department, Katowice (Poland); Szafron, B.; Konefal, A.; Zipper, W. [University of Silesia, Department of Nuclear Physics and Its Applications, Katowice (Poland)

2014-05-15

The goal of this work was to assess the additional dose from secondary neutrons and γ-rays generated during total body irradiation (TBI) using a medical linac X-ray beam. Nuclear reactions that occur in the accelerator construction during emission of high-energy beams in teleradiotherapy are the source of secondary radiation. Induced activity is dependent on the half-lives of the generated radionuclides, whereas neutron flux accompanies the treatment process only. The TBI procedure using a 18 MV beam (Clinac 2100) was considered. Lateral and anterior-posterior/posterior-anterior fractions were investigated during delivery of 2 Gy of therapeutic dose. Neutron and photon flux densities were measured using neutron activation analysis (NAA) and semiconductor spectrometry. The secondary dose was estimated applying the fluence-to-dose conversion coefficients. The main contribution to the secondary dose is associated with fast neutrons. The main sources of γ-radiation are the following: {sup 56}Mn in the stainless steel and {sup 187}W of the collimation system as well as positron emitters, activated via (n,γ) and (γ,n) processes, respectively. In addition to 12 Gy of therapeutic dose, the patient could receive 57.43 mSv in the studied conditions, including 4.63 μSv from activated radionuclides. Neutron dose is mainly influenced by the time of beam emission. However, it is moderated by long source-surface distances (SSD) and application of plexiglass plates covering the patient body during treatment. Secondary radiation gives the whole body a dose, which should be taken into consideration especially when one fraction of irradiation does not cover the whole body at once. (orig.) [German] Die zusaetzliche Dosis durch sekundaere Neutronen- und γ-Strahlung waehrend der Ganzkoerperbestrahlung mit Roentgenstrahlung aus medizinischen Linearbeschleunigern wurde abgeschaetzt. Bei der Emission hochenergetischer Strahlen zur Teletherapie finden hauptsaechlich im Beschleuniger

Improved Technique for the Determination of Uranium Minor Isotopes Concentrations in Microparticles by Using Secondary Ion Mass-Spectrometer in Multicollection Mode

International Nuclear Information System (INIS)

Aleshin, M.; Elantyev, I.; Stebelkov, Y.

2015-01-01

Traditional method of the analysis implies simultaneous measuring of secondary ion currents of isotopes 234U + , 235U + , 238U + , ions with mass 236 amu (236U + and 235UH + ) and hydride ions 238UH + by using mass-spectrometer Cameca IMS1280 in multicollection mode. Calculating of uranium isotopic composition is performed using the results of 40 successive measurements of those currents (cycles). Duration of each measurement is 8 s. Small amounts of uranium minor isotopes are limitation for precise determination of their concentrations. To prevent the damage of the secondary ions detector the intensity of ion current should be no more than 5 x 10 5 s -1 . This limitation does not allow setting a higher primary ion current for the increasing of minor uranium isotopes ions emission because of the signal of ions 238U + gets too high. New technique is developed to improve the accuracy of determination of uranium minor isotopes concentrations. Process of measurement is divided on two steps. First step is a measurement of ion currents during 20 cycles by five detectors. The second step implies the elimination of ions 238U + hitting to the detector and 10 times increasing of primary ion current. The ratio 235U/238U is calculated from the first step results, so uncertainty of determination of this value is 1.4 times bigger than with duration of 40 cycles of the measurement. The ratios 234U/235U and 236U/235U are calculated during the second step. This technique allows to determine content of 234U and 236U with 3 and 5 times less uncertainties respectively, but with different degree of the sputtering particles. Moreover the duration of each cycle was set less (1 second) to use data more efficient. The technique accordingly with every second counting provides uncertainty of determination 236U concentration 4 times less than traditional method at the same degree of sputtering particles. (author)

Secondary ion mass spectrometry induced damage adjacent to analysis craters in silicon

International Nuclear Information System (INIS)

Clark, M.H.; Jones, K.S.; Stevie, F.A.

2002-01-01

Damage introduced by dynamic secondary ion mass spectrometry (SIMS) depth profiling is studied. A silicon sample with a boron marker layer was depth profiled by dynamic SIMS. After subsequent annealing at 750 deg. C for 30 min, the SIMS sample was reanalyzed by plan-view transmission electron microscope (PTEM) and SIMS. PTEM images showed the presence of interstitial defects near the original SIMS crater, and SIMS depth profiles of similar regions exhibited boron diffusivity enhancements. Excess interstitials were introduced into the Si surface up to 2 mm from the original 225 μmx225 μm crater. Both PTEM and SIMS results showed that the damage and its effects diminished with an increase in distance from the original crater

The use of secondary ion mass spectrometry for uranium analysis in bioassays

International Nuclear Information System (INIS)

Amaral, Ademir de Jesus

1997-01-01

Today many researches are performed to use mass spectrometry as complementary methods to the alpha spectrometry. In this study performance of the secondary ion mass spectrometry (SIMS) are evaluated for traces of uranium analysis in biological tissues and more particularly in urine. A special attention is done for the samples preparation, using thin polymers. the SIMS method feasibility is presented. The second part of the thesis deals with the use of a tracer to quantify the urinary uranium, the 233 U. The isotopic ratio are obtained with a detection limit of 10 -6 Bq in 238 U per urine litre. Other biological samples are studied to illustrate the adaptability of the SIMS method to internal dosimetry. (A.L.B.)

Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding

Science.gov (United States)

Wittmaack, Klaus

2013-03-01

Exposure of ion bombarded solids to Cs gives rise to a very strong enhancement of the yields of negatively charged secondary ions and, concurrently, to a lowering of positive ion yields. The phenomena have been explored in a large number of experimental and theoretical studies but attempts to clarify the mechanism of ion formation were not as successful as assumed. This review examines the state of the art in Cs controlled secondary ion mass spectrometry (SIMS) in great detail, with due consideration of low-energy alkali-ion scattering. In very basic studies on alkali induced secondary ion yield changes, sub-monolayer quantities of Cs or Li were deposited on the sample surface, followed by low-fluence ion bombardment, to avoid significant damage. If SIMS is applied to characterise the composition of solid materials, the simplest approach to achieving sample erosion as well as high negative-ion yields is bombardment with primary ions of Cs. Two other methods of sample loading with Cs provide more flexibility, (i) exposure to a collimated beam of Cs vapour and concurrent bombardment with high-energy non-Cs ions and (ii) the mixed-beam approach involving quasi-simultaneous bombardment with Cs and Xe ions. Both concepts have the advantage that undesirable sample overload with Cs can be avoided. High Cs concentrations reduce the formation probability of target specific molecular ions and lower the yields of all types of positive secondary ions, including Cs+, M+, X+, MCs+ and XCs+ (M and X denoting matrix and impurity elements). Quantitative SIMS analysis using MCs+ and XCs+ ions appears feasible, provided the Cs coverage is kept below about 5%. The semi-classical model of resonant charge transfer, also known as the tunnelling model, has long been considered a solid framework for the interpretation of Cs and Li based SIMS data. The model predicts ionisation probabilities for cases in which, at shallow distances from the surface, the affinity (ionisation) level of the

Brominated Tyrosine and Polyelectrolyte Multilayer Analysis by Laser Desorption VUV Postionization and Secondary Ion Mass Spectrometry

Energy Technology Data Exchange (ETDEWEB)

University of Illinois at Chicago; Blaze, Melvin M. T.; Takahashi, Lynelle; Zhou, Jia; Ahmed, Musahid; Gasper, Gerald; Pleticha, F. Douglas; Hanley, Luke

2011-03-14

The small molecular analyte 3,5-dibromotyrosine (Br2Y) and chitosan-alginate polyelectrolyte multilayers (PEM) with and without adsorbed Br2Y were analyzed by laser desorption postionization mass spectrometry (LDPI-MS). LDPI-MS using 7.87 eV laser and tunable 8 ? 12.5 eV synchrotron vacuum ultraviolet (VUV) radiation found that desorption of clusters from Br2Y films allowed detection by≤8 eV single photon ionization. Thermal desorption and electronic structure calculations determined the ionization energy of Br2Y to be ~;;8.3?0.1 eV and further indicated that the lower ionization energies of clusters permitted their detection at≤8 eV photon energies. However, single photon ionization could only detect Br2Y adsorbed within PEMs when using either higher photon energies or matrix addition to the sample. All samples were also analyzed by 25 keV Bi3 + secondary ion mass spectrometry (SIMS), with the negative ion spectra showing strong parent ion signal which complemented that observed by LDPI-MS. The negative ion SIMS depended strongly on the high electron affinity of this specific analyte and the analyte?s condensed phase environment.

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Science.gov (United States)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-01

Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An ;equivalent work function; is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called ;work function; (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Ion emission microscope microanalyzer

International Nuclear Information System (INIS)

Cherepin, V.T.; Olckovsky, V.L.

1977-01-01

In the ion microanalyzer (microprobe) the object is exposed to the bombardment of a highly focused ion beam, the secondary ions emitted from the object being analyzed by means of a mass filter. In order to be able to control the position of an analysis synchronous to the local analysis of an object an ion-optical converter (electron image with a fluorescent screen) is placed behind the aperture diaphragm in the direction of the secondary ion beam. The converter allows to make visible in front of the mass filter a non-split ion image characterizing the surface of the surface investigated. Then a certain section may be selected for performing chemical and isotope analyses. (DG) [de

Thin, Flexible Secondary Li-Ion Paper Batteries

KAUST Repository

Hu, Liangbing; Wu, Hui; La Mantia, Fabio; Yang, Yuan; Cui, Yi

2010-01-01

, flexible Li-ion batteries using paper as separators and free-standing carbon nanotube thin films as both current collectors. The current collectors and Li-ion battery materials are integrated onto a single sheet of paper through a lamination process

Revisiting the total ion yield x-ray absorption spectra of liquid water microjets

International Nuclear Information System (INIS)

Saykally, Richard J; Cappa, Chris D.; Smith, Jared D.; Wilson, Kevin R.; Saykally, Richard J.

2008-01-01

Measurements of the total ion yield (TIY) x-ray absorption spectrum (XAS) of liquid water by Wilson et al. (2002 J. Phys.: Condens. Matter 14 L221 and 2001 J. Phys. Chem. B 105 3346) have been revisited in light of new experimental and theoretical efforts by our group. Previously, the TIY spectrum was interpreted as a distinct measure of the electronic structure of the liquid water surface. However, our new results indicate that the previously obtained spectrum may have suffered from as yet unidentified experimental artifacts. Although computational results indicate that the liquid water surface should exhibit a TIY-XAS that is fundamentally distinguishable from the bulk liquid XAS, the new experimental results suggest that the observable TIY-XAS is actually nearly identical in appearance to the total electron yield (TEY-)XAS, which is a bulk probe. This surprising similarity between the observed TIY-XAS and TEY-XAS likely results from large contributions from x-ray induced electron stimulated desorption of ions, and does not necessarily indicate that the electronic structure of the bulk liquid and liquid surface are identical

Studies on the determination of surface deuterium in AISI 1062, 4037, and 4140 steels by secondary ion mass spectrometry

Science.gov (United States)

Sastri, V. S.; Donepudi, V. S.; McIntyre, N. S.; Johnston, D.; Revie, R. W.

1988-12-01

The concentration of deuterium at the surface of cathodically charged high strength steels AISI 1062, 4037, and 4140 has been determined by secondary ion mass spectrometry (SIMS). The beneficial effects of pickling in NAP (a mixture of nitric, acetic, and phosphoric acids) to remove surfacebound deuterium have been observed.

Experimental study on the secondary emission (atomic and molecular ions, aggregates, electrons) induced by the bombardment of surfaces by means of energetic heavy ions (∼ MeV/u). Effects of the charge state of the projectiles

International Nuclear Information System (INIS)

Monart, B.

1988-05-01

The ionic and electronic emissions, induced by the sputtering of solid targets (organic and inorganic) with 1 MeV/u projectiles. The time-of-flight spectrometry is applied to the secondary emission analysis. The projectile velocity, the angle of attack (between the beam and the target), and the projectile's incident charge state, are taken into account. It is shown that the secondary emission depends on the charge of the incident ion and on the charge state changement in the material's bulk. A model, applying the theoretical calculations concerning the charge in the material's bulk, is proposed. The existence of an interaction depth, for the incident ion and the material, which depends on the secondary ions type and on the incident ion charge, is suggested. The calculated depth is about 200 angstroms for the aggregates ejected from a CsI target, sputtered with 14 Kr 18+ . The H + yield (coming from ∼ 10 angstroms) is used as a projectile charge probe, at the material surface. The experimental method allows, for the first time, the obtention of the equilibrium charge state in the condensed matter. The same method is applied to determine the non-equilibrium charges in the bulk of thin materials. The results show that, after leaving the material, the projectile presents a post-ionization state [fr

Dynamic Secondary Ion Mass Spectrometry | Materials Science | NREL

Science.gov (United States)

Ion Mass Spectrometry (SIMS) uses a continuous, focused beam of primary ions to remove material from the surface of a sample by sputtering. The fraction of sputtered material that is ionized is extracted Identifies all elements or isotopes present in a material, from hydrogen to uranium. Different primary-ion

A Virtual Research Environment for a Secondary Ion Mass Spectrometer (SIMS)

Science.gov (United States)

Wiedenbeck, M.; Schäfer, L.; Klump, J.; Galkin, A.

2013-12-01

Overview: This poster describes the development of a Virtual Research Environment for the Secondary Ion Mass Spectrometer (SIMS) at GFZ Potsdam. Background: Secondary Ion Mass Spectrometers (SIMS) are extremely sensitive instruments for analyzing the surfaces of solid and thin film samples. These instruments are rare, expensive and experienced operators are very highly sought after. As such, measurement time is a precious commodity, until now only accessible to small numbers of researchers. The challenge: The Virtual SIMS Project aims to set up a Virtual Research Environment for the operation of the CAMECA IMS 1280-HR instrument at the GFZ Potsdam. The objective of the VRE is to provide SIMS access not only to researchers locally present in Potsdam but also to scientists working with SIMS cooperation partners in e.g., South Africa, Brazil or India. The requirements: The system should address the complete spectrum of laboratory procedures - from online application for measurement time, to remote access for data acquisition to data archiving for the subsequent publication and for future reuse. The approach: The targeted Virtual SIMS Environment will consist of a: 1. Web Server running the Virtual SIMS website providing general information about the project, lab access proposal forms and calendar for the timing of project related tasks. 2. LIMS Server, responsible for scheduling procedures, data management and, if applicable, accounting and billing. 3. Remote SIMS Tool, devoted to the operation of the experiment within a remote control environment. 4. Publishing System, which supports the publication of results in cooperation with the GFZ Library services. 5. Training Simulator, which offers the opportunity to rehearse experiments and to prepare for possible events such as a power outages or interruptions to broadband services. First results: The SIMS Virtual Research Environment will be mainly based on open source software, the only exception being the CAMECA IMS

X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of aging effects on the mineral fibers treated with aminopropylsilane and quaternary ammonium compounds

DEFF Research Database (Denmark)

Zafar, Ashar; Schjødt-Thomsen, Jan; Sodhi, R.

2012-01-01

(PCA) was applied to the time-of-flight secondary ion mass spectrometry spectra, and an increase in the intensities of APS characteristic peaks were observed after aging. The observed increase in the signals of APS originates from underlying silanized fibers after the removal of the surfactant......X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry were used to investigate the aging effects on the aminopropylsilane (APS) and quaternary ammonium surfactant-treated mineral fibers. APS-coated mineral fiber samples were treated with cationic surfactant...

Study of secondary particles produced in central 12C-nucleus reactions at 4.5 AGeV

International Nuclear Information System (INIS)

Saleem Khan, M.; Shukla, Praveen Prakash; Khushnood, H.

2014-01-01

Study of secondary charged particles produced in central relativistic heavy ion interactions is attracting a great deal of attention during the recent years. It may be due to the fact that the study of totally disintegrated events produced in heavy ion collisions in which almost the whole projectile takes part in the reactions. On the basis of the study of the totally disintegrated events of Ag and Br nuclei caused by 4.5 GeV per nucleon carbon projectile, we may conclude that the distribution of charged shower particles produced in forward hemisphere is flatter than the distribution in the backward hemisphere

Outcome of total parathyroidectomy and autotransplantation as treatment of secondary and tertiary hyperparathyroidism in children and adults.

NARCIS (Netherlands)

Kievit, A.J.; Tinnemans, J.G.; Idu, M.M.; Groothoff, J.W.; Surachno, S.; Aronson, D.C.

2010-01-01

BACKGROUND: Treatment safety and effectiveness of total parathyroidectomy and autotransplantation for secondary and tertiary hyperparathyroidism have been extensively proven in adults; the evidence for children, however, is scarce. Children and adolescents cannot simply be seen as young adults in

Impact-parameter dependence of the total probability for electromagnetic electron-positron pair production in relativistic heavy-ion collisions

International Nuclear Information System (INIS)

Hencken, K.; Trautmann, D.; Baur, G.

1995-01-01

We calculate the impact-parameter-dependent total probability P total (b) for the electromagnetic production of electron-positron pairs in relativistic heavy-ion collisions in lowest order. We study expecially impact parameters smaller than the Compton wavelength of the electron, where the equivalent-photon approximation cannot be used. Calculations with and without a form factor for the heavy ions are done; the influence is found to be small. The lowest-order results are found to violate unitarity and are used for the calculation of multiple-pair production probabilities with the help of the approximate Poisson distribution already found in earlier publications

RAPD analysis of Arabidopsis thaliana transferred with total DNA of cabbage by ion beam

International Nuclear Information System (INIS)

Bian Po; Yu Zengliang; Qin Guangyong; Huo Yuping; Wang Yan

2003-01-01

Two mutants were found among the Arabidopsis thaliana transferred with total DNA of cabbage. Variation of genome of T6 and its offspring were analyzed by RAPD-PCR with 40 random primers. The result from S168 primer was different from the CK, indicating that variation of genome can be made by total DNA transferring by use of ion beam, and this variation is hereditary. It is found that S 168-1850 is included within the gene of ABC transporter by aligning with genome of Arabidopsis thaliana in TAIT

Ionic secondary emission SIMS principles and instrumentation

International Nuclear Information System (INIS)

Darque-Ceretti, E.; Migeon, H.N.; Aucouturier, M.

1998-01-01

The ionic analysis by secondary emission (SIMS) is one of material analysis based on the ions bombardment. That is micro-analysis method in taking into account that the dimensions of the analysed volume are under the micrometer. This paper details in a first part some ionic secondary emission principle to introduce a description of the instrumentation: microprobe, ions production, spectrometers. (A.L.B.)

Outcome of Total Parathyroidectomy and Autotransplantation as Treatment of Secondary and Tertiary Hyperparathyroidism in Children and Adults

NARCIS (Netherlands)

Kievit, A. J.; Tinnemans, J. G. M.; Idu, M. M.; Groothoff, J. W.; Surachno, S.; Aronson, D. C.

2010-01-01

Treatment safety and effectiveness of total parathyroidectomy and autotransplantation for secondary and tertiary hyperparathyroidism have been extensively proven in adults; the evidence for children, however, is scarce. Children and adolescents cannot simply be seen as young adults in the case of

Secondary knee instability caused by fracture of the stabilizing insert in a dual-articular total knee

DEFF Research Database (Denmark)

Boesen, Morten P; Jensen, Tim Toftgaard; Husted, Henrik

2004-01-01

A case of a fractured polyethylene stabilizing insert causing secondary knee instability in a Dual-articular total knee arthroplasty (TKA) is presented. A 65-year-old woman who underwent surgery with a Dual-articular TKA 4 years earlier had a well-functioning prosthesis until a fall, after which......-articular knee....

Secondary partitioning isotope effects on solvolytic ion pair intermediates

International Nuclear Information System (INIS)

Abbey, K.J.

1976-01-01

The thermal decomposition of N-benzhydryl N-nitrosobenzamide (BNB) has been shown to produce an ion pair which either forms ester or reacts with the solvent. In ethanol, the fraction of ester produced, R, was much smaller than R values obtained from solvolysis or from the diphenyldiazomethane (DDM)-benzoic acid reaction, which was suggested to yield the same ion pair as solvolysis. This difference led to the conclusion that the ionic species for the nitrosamide decomposition is a nitrogen-separated ion pair. This study was initiated on the assumption that BNB led to solvolytic ion pairs, but that both the intimate and solvent-separated ion pairs were produced directly from the nitrosamide. The use of α-tritiated BNB for the study of partitioning isotope effects (PIE's) in this system led to activity ratios much lower than expected from other reported work. Results of studies of ''special'' salt effect were not consistent for all situations, but the results do suggest that the assumption that BNB leads to solvolytic ion pairs is probably valid. The investigation of the more stable p-methoxybenzhydryl benzoate system proved to be highly productive. The ester fraction produced, R, responded dramatically to the addition of common-ion as well as ''special'' salts. The functional relationship of R on salt concentration could be explained in terms of Winstein's solvolytic scheme where the intimate ion pair, the solvent-separated ion pair, and the dissociated ion were important. Tritium-labelled compounds were used for PIE studies on 3 different compounds, and three different methods of reaction are proposed

High-transverse-momentum secondaries and rising total cross sections in cosmic-ray interactions

CERN Document Server

Cline, D; Luthe, J

1973-01-01

The authors draw attention to hadron collisions from cosmic-ray data showing evidence for high-transverse-momentum secondaries in substantial excess of the celebrated exponential cutoff, analogous to recent observations at the CERN intersecting storage rings. The data support a composite (parton/quark) picture of the proton in which deep inelastic proton collisions at high energy ( approximately 10/sup 3/ GeV) produce constituents, observed through hadron jets. This phenomenon is possibly connected to the rise of the total cross section observed in the same range of energy. (24 refs).

Charge mechanism analysis of lithium ion secondary battery. X-ray absorption spectroscopy and first-principles calculations

International Nuclear Information System (INIS)

Kubobuchi, Kei; Imai, Hideto

2015-01-01

Redox reaction behaviors of a lithium ion secondary battery were investigated by K-edge in-situ XANES and L-edge XANES measurements combined with ab initio XANES simulation. During the charge process, the shape of K-edge XANES spectra was found to change, suggesting contribution of Mn 3d electron to charge and discharge. The detailed analysis based on first-principles electronic structure calculation and ab initio XANES simulation, however, indicated that valence change of Mn is little and rather O largely contribute to the reaction. (author)

Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method.

Science.gov (United States)

Konicek, Andrew R; Lefman, Jonathan; Szakal, Christopher

2012-08-07

We present a novel method for correlating and classifying ion-specific time-of-flight secondary ion mass spectrometry (ToF-SIMS) images within a multispectral dataset by grouping images with similar pixel intensity distributions. Binary centroid images are created by employing a k-means-based custom algorithm. Centroid images are compared to grayscale SIMS images using a newly developed correlation method that assigns the SIMS images to classes that have similar spatial (rather than spectral) patterns. Image features of both large and small spatial extent are identified without the need for image pre-processing, such as normalization or fixed-range mass-binning. A subsequent classification step tracks the class assignment of SIMS images over multiple iterations of increasing n classes per iteration, providing information about groups of images that have similar chemistry. Details are discussed while presenting data acquired with ToF-SIMS on a model sample of laser-printed inks. This approach can lead to the identification of distinct ion-specific chemistries for mass spectral imaging by ToF-SIMS, as well as matrix-assisted laser desorption ionization (MALDI), and desorption electrospray ionization (DESI).

pH buffers for sea water media based on the total hydrogen ion concentration scale

Science.gov (United States)

Dickson, Andrew G.

1993-01-01

Published e.m.f. values measured using the cell ? where p° = 101.325 kPa, and BH + and B are the conjugate acid-base pairs of 2-aminopyridine, 2-amino-2-hydroxymethyl-1,3-propanediol (tris), tetrahydro-1,4-isoxazine (morpholine), and 2-amino-2-methyl-1, 3-propanediol (bis), have been re-evaluated to assign pH values based on the "total" hydrogen ion concentration scale to equimolal ( m =0.04 mol kg -1) buffer solutions based on these compounds. These pH values are consistent with the best available equilibrium constants for acid-base processes in sea water and such pH buffers can be used as pH calibration standards to measure accurate values for oceanic pH on the "total" hydrogen ion pH scale. In addition, the published e.m.f. results for these various amine bases have been used to calculate their respective acidity constants on this pH scale.

Mass spectroscopy of recoiled ions, secondary ion mass spectroscopy, and Auger electron spectroscopy investigation of Y2O3-stabilized ZrO2(100) and (110)

International Nuclear Information System (INIS)

Herman, G.S.; Henderson, M.A.; Starkweather, K.A.; McDaniel, E.P.

1999-01-01

We have studied the (100) and (110) surfaces of yttria-stabilized cubic ZrO 2 using Auger electron spectroscopy, low energy electron diffraction (LEED), direct recoil spectroscopy, mass spectroscopy of recoiled ions (MSRI), and secondary ion mass spectroscopy (SIMS). The concentration of yttrium at the surface was weakly influenced by the surface structure under the experimental conditions investigated. Both MSRI and SIMS indicated a more enhanced yttrium signal than zirconium signal at the surface compared to the respective bulk concentrations. The surfaces were not very well ordered as indicated by LEED. The yttria-stabilized cubic ZrO 2 single crystal surfaces may not be a suitable model material for pure phase ZrO 2 surfaces due to significant yttria concentrations at the surface. copyright 1999 American Vacuum Society

Comparison of specular H-atomic-beam intensity and C+ secondary-ion yield at thermally activated decrease of a carbon layer on a Ni(110) surface

International Nuclear Information System (INIS)

Kaarmann, H.; Hoinkes, H.; Wilsch, H.

1983-01-01

The thermally activated disappearance of a carbon layer on a Ni(110) surface was investigated by the scattering of atomic hydrogen and by secondary-ion mass spectrometry. Decreasing C coverage at surface temperatures kept constant in each case at values between 650 and 750 K resulted in an exponential decrease of specular H-beam intensity as well as C + secondary-ion yield. This decrease in both cases fits first-order kinetics (presumable diffusion into the bulk) with an identical rate constant as a function of surface temperature and results finally in a preexponential frequency ν = 10/sup() 10plus-or-minus1/ s -1 and an activation energy E/sub A/ = 1.8 +- 0.2 eV

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Directory of Open Access Journals (Sweden)

Patrick Philipp

2016-11-01

Full Text Available The analysis of polymers by secondary ion mass spectrometry (SIMS has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM, which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.

Surface behavior based on ion-induced secondary electron emission from semi-insulating materials in breakdown evolution

Energy Technology Data Exchange (ETDEWEB)

Koc, Emrah; Karakoese, Sema [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Salamov, Bahtiyar G. [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Institute of Physics, National Academy of Science, 1143 Baku (Azerbaijan)

2013-09-15

This study focuses on analyses of secondary electron emission (SEE) at semiconductor surfaces when the sufficient conditions of space-time distribution occur. Experimental measurements and calculations with the approach of Townsend coefficients, which include the evaluations of ionization coefficient ({alpha}) and SEE coefficient ({gamma}) were performed in high-ohmic InP, GaAs, and Si semiconductor cathodes with argon and air environments in a wide range of E/N (300-10 000 Td). The direct calculations of {gamma} were carried out to determine the behavior of cold-semiconductor cathode current in a wide range of microgaps (45-525 {mu}m). Paschen curves are interpreted in the dependence of large pd range on breakdown voltage through {gamma} and {alpha}/N. Ion-induced secondary electrons exhibit the direct behaviors affecting the timescale of breakdown evolution in the vicinity of the Paschen minimum during the natural bombardment process with ions of semiconductor cathodes. Also, when {alpha}/N rapidly drops and the excitations of gas atoms densely occupy the gas volume, we determined that the photoelectric effect provides a growth for electron emission from semiconductor surfaces at the breakdown stage at the reduced values of E/N. At all pressures, the emission magnitudes of electrons liberated by semiconductor cathodes into vacuum are found as {gamma}{sub InP} > {gamma}{sub GaAs} > {gamma}{sub Si} in breakdown evolution. (copyright 2013 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Secondary cell wall development in cotton fibers as examined with attenuated total reflection Fourier transform infrared spectroscopy

Science.gov (United States)

Cotton fibers harvested at 18, 20, 24, 28, 32, 36 and 40 days after flowering were examined using attenuated total reflection Fourier transform-infrared (ATR FT-IR) spectroscopy. The selected harvesting points coincide with secondary cell wall (SCW) development in the fibers. Progressive but moderat...

Development of focused ion beam systems with various ion species

International Nuclear Information System (INIS)

Ji Qing; Leung, K.-N.; King, Tsu-Jae; Jiang Ximan; Appleton, Bill R.

2005-01-01

Conventional focused ion beam systems employ a liquid-metal ion source (LMIS) to generate high-brightness beams, such as Ga + beams. Recently there has been an increased need for focused ion beams in areas like biological studies, advanced magnetic-film manufacturing and secondary-ion mass spectroscopy (SIMS). In this article, status of development on focused ion beam systems with ion species such as O 2 + , P + , and B + will be reviewed. Compact columns for forming focused ion beams from low energy (∼3keV), to intermediate energy (∼35keV) are discussed. By using focused ion beams, a SOI MOSFET is fabricated entirely without any masks or resist

Imaging of Crystalline and Amorphous Surface Regions Using Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): Application to Pharmaceutical Materials.

Science.gov (United States)

Iuraş, Andreea; Scurr, David J; Boissier, Catherine; Nicholas, Mark L; Roberts, Clive J; Alexander, Morgan R

2016-04-05

The structure of a material, in particular the extremes of crystalline and amorphous forms, significantly impacts material performance in numerous sectors such as semiconductors, energy storage, and pharmaceutical products, which are investigated in this paper. To characterize the spatial distribution for crystalline-amorphous forms at the uppermost molecular surface layer, we performed time-of-flight secondary-ion mass spectroscopy (ToF-SIMS) measurements for quench-cooled amorphous and recrystallized samples of the drugs indomethacin, felodipine, and acetaminophen. Polarized light microscopy was used to localize crystallinity induced in the samples under controlled conditions. Principal component analysis was used to identify the subtle changes in the ToF-SIMS spectra indicative of the amorphous and crystalline forms for each drug. The indicators of amorphous and crystalline surfaces were common in type across the three drugs, and could be explained in general terms of crystal packing and intermolecular bonding, leading to intramolecular bond scission in the formation of secondary ions. Less intramolecular scission occurred in the amorphous form, resulting in a greater intensity of molecular and dimer secondary ions. To test the generality of amorphous-crystalline differentiation using ToF-SIMS, a different recrystallization method was investigated where acetaminophen single crystals were recrystallized from supersaturated solutions. The findings indicated that the ability to assign the crystalline/amorphous state of the sample using ToF-SIMS was insensitive to the recrystallization method. This demonstrates that ToF-SIMS is capable of detecting and mapping ordered crystalline and disordered amorphous molecular materials forms at micron spatial resolution in the uppermost surface of a material.

Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

Energy Technology Data Exchange (ETDEWEB)

Huang, Di; Hua, Xin; Xiu, Guang-Li; Zheng, Yong-Jie; Yu, Xiao-Ying; Long, Yi-Tao

2017-10-01

Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization of PM is important since the chemical heterogeneity between the surface and bulk may vary its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, capable of high spatial chemical imaging and depth profiling. Recent research shows that SIMS holds great potential in analyzing both surface and bulk chemical information of PM. In this review, we presented the working principal of SIMS in PM characterization, summarized recent applications in PM analysis from different sources, discussed its advantages and limitations, and proposed the future development of this technique with a perspective in environmental sciences.

Ochronosis of the knee with secondary osteoarthritis requiring total knee replacement in a patient with cryptogenic organising pneumonia.

Science.gov (United States)

Jasper, Jorrit; Metsaars, Wieneke; Jansen, Joris

2016-05-20

Ochronosis is a rare autosomal recessive metabolic disease caused by homogentisic acid oxidase enzyme deficiency. High homogentisic acid levels will eventually result in black deposits in skin, sclerae, connective tissues and urine (alkaptonuria). It can lead to early degeneration of connective tissues and cartilage. Ochronosis can damage normal cartilage, leading to secondary osteoarthritis. The diagnosis is often delayed because of its low prevalence and non-specific early symptoms. In our patient, the secondary osteoarthritis due to ochronosis deposits in the cartilage was treated by total knee arthroplasty, with good clinical outcome. This article reports the first case of ochronosis with secondary osteoarthritis of the knee in a patient previously diagnosed with cryptogenic organising pneumonia (COP). 2016 BMJ Publishing Group Ltd.

Characterization of the secondary neutron field produced during treatment of an anthropomorphic phantom with x-rays, protons and carbon ions

Science.gov (United States)

La Tessa, C.; Berger, T.; Kaderka, R.; Schardt, D.; Burmeister, S.; Labrenz, J.; Reitz, G.; Durante, M.

2014-04-01

Short- and long-term side effects following the treatment of cancer with radiation are strongly related to the amount of dose deposited to the healthy tissue surrounding the tumor. The characterization of the radiation field outside the planned target volume is the first step for estimating health risks, such as developing a secondary radioinduced malignancy. In ion and high-energy photon treatments, the major contribution to the dose deposited in the far-out-of-field region is given by neutrons, which are produced by nuclear interaction of the primary radiation with the beam line components and the patient’s body. Measurements of the secondary neutron field and its contribution to the absorbed dose and equivalent dose for different radiotherapy technologies are presented in this work. An anthropomorphic RANDO phantom was irradiated with a treatment plan designed for a simulated 5 × 2 × 5 cm3 cancer volume located in the center of the head. The experiment was repeated with 25 MV IMRT (intensity modulated radiation therapy) photons and charged particles (protons and carbon ions) delivered with both passive modulation and spot scanning in different facilities. The measurements were performed with active (silicon-scintillation) and passive (bubble, thermoluminescence 6LiF:Mg, Ti (TLD-600) and 7LiF:Mg, Ti (TLD-700)) detectors to investigate the production of neutral particles both inside and outside the phantom. These techniques provided the whole energy spectrum (E ⩽ 20 MeV) and corresponding absorbed dose and dose equivalent of photo neutrons produced by x-rays, the fluence of thermal neutrons for all irradiation types and the absorbed dose deposited by neutrons with 0.8 energy x-rays, the contribution of secondary neutrons to the dose equivalent is of the same order of magnitude as the primary radiation. In carbon therapy delivered with raster scanning, the absorbed dose deposited by neutrons in the energy region between 0.8 and 10 MeV is almost two orders of

Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C{sub 60}{sup +}-Ar{sup +} co-sputtering

Energy Technology Data Exchange (ETDEWEB)

Chang, Chi-Jen [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Chang, Hsun-Yun; You, Yun-Wen; Liao, Hua-Yang [Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China); Kuo, Yu-Ting; Kao, Wei-Lun; Yen, Guo-Ji; Tsai, Meng-Hung [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Shyue, Jing-Jong, E-mail: shyue@gate.sinica.edu.tw [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China)

2012-03-09

Highlights: Black-Right-Pointing-Pointer Multiple peptides are detected and quantified at the same time without labeling. Black-Right-Pointing-Pointer C{sub 60}{sup +} ion is responsible for generating molecular-specific ions at high mass. Black-Right-Pointing-Pointer The co-sputtering yielded more steady depth profile and more well defined interface. Black-Right-Pointing-Pointer The fluence of auxiliary Ar{sup +} does not affect the quantification curve. Black-Right-Pointing-Pointer The damage from Ar{sup +} is masked by high sputtering yield of C{sub 60}{sup +}. - Abstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C{sub 60}{sup +} primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C{sub 60}{sup +} primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01-2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar{sup +} was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C{sub 60}{sup +} bombardment, which suppressed the ion intensities during the depth

Ion detection in mass spectrometry

International Nuclear Information System (INIS)

Bolbach, Gerard

2016-03-01

This course aims at providing some elements for a better understanding of ion detectors used in mass spectrometers, of their operations, and of their limitations. A first part addresses the functions and properties of an ideal detector, how to detect ions in gas phase, and particle detectors and ion detectors used in mass spectrometry. The second part proposes an overview of currently used detectors with respect to their operation principle: detection from the ion charge (Faraday cylinder), detection by inductive effects (FTICR, Fourier Transform Ion Cyclotron Resonance), and detection by secondary electron emission. The third part discusses the specificities of secondary electron emission. The fourth one addresses operating modes and parameters related to detectors. The sixth part proposes a prospective view on future detectors by addressing the following issues: cryo-detector, inductive effect and charge detectors, ion detection and nano materials

Study of secondary electron emission from thin carbon targets with swift charged particles: heavy ions, hydrogen ions; Etude experimentale de l`emission electronique secondaire de cibles minces de carbone sous l`impact de projectiles rapides: ions lourds, ions hydrogene (atomiques, moleculaires ou sous forme d`agregats)

Energy Technology Data Exchange (ETDEWEB)

Billebaud, A

1995-07-12

The main subject of this work is the study of electron emission from the two surfaces of thin solid targets bombarded with swift charged particles. The slowing down of swift ions in matter is mainly due to inelastic interaction with target electrons (ionization, excitation): the energy transfer to target electrons is responsible for the secondary electron emission process. The phenomenological and theoretical descriptions of this phenomena are the subject of the first chapter. We focused on secondary electron emission induced by different kind of projectiles on thin carbon foils. In chapter two we describe hydrogen cluster induced electron emission measurement between 40 and 120 keV/proton. These projectiles, composed of several atoms, allowed us to study and highlight collective effects of the electron emission process. We extended our study of electron emission to molecular (H{sub 2}{sup +}, H{sub 3}{sup +}) and composite (H{sup -}, H{sup 0}) projectiles at higher energies (<= 2 MeV): we have designed an experimental set-up devoted to electron emission statistics measurements which allowed us to study, among others things, the role of projectile electrons in secondary electron emission. This experiment is described in the third chapter. Finally, the fourth chapter describes new measurements of electron emission induced by energetic (13 MeV/u) and highly charged argon ion provided by the medium energy beam line (SME) of GANIL (Caen), which have been analyzed in the framework of a semi-empirical model of secondary electron emission. This set of experiments brings new results on composite projectile interaction with matter, and on the consequences of high energy deposition in solids. (author).

Thin, Flexible Secondary Li-Ion Paper Batteries

KAUST Repository

Hu, Liangbing

2010-10-26

There is a strong interest in thin, flexible energy storage devices to meet modern society needs for applications such as interactive packaging, radio frequency sensing, and consumer products. In this article, we report a new structure of thin, flexible Li-ion batteries using paper as separators and free-standing carbon nanotube thin films as both current collectors. The current collectors and Li-ion battery materials are integrated onto a single sheet of paper through a lamination process. The paper functions as both a mechanical substrate and separator membrane with lower impedance than commercial separators. The CNT film functions as a current collector for both the anode and the cathode with a low sheet resistance (∼5 Ohm/sq), lightweight (∼0.2 mg/cm2), and excellent flexibility. After packaging, the rechargeable Li-ion paper battery, despite being thin (∼300 μm), exhibits robust mechanical flexibility (capable of bending down to <6 mm) and a high energy density (108 mWh/g). © 2010 American Chemical Society.

Secondary electron ion source neutron generator

Science.gov (United States)

Brainard, John P.; McCollister, Daryl R.

1998-01-01

A neutron generator employing an electron emitter, an ion source bombarded by the electrons from the electron emitter, a plasma containment zone, and a target situated between the plasma containment zone and the electron emitter. The target contains occluded deuterium, tritium, or a mixture thereof

Emission of positive oxygen ions from ion bombardment of adsorbate-covered metal surfaces

International Nuclear Information System (INIS)

Kaurin, M.G.

1989-01-01

During ion bombardment of metal surfaces, collision cascades can result in the emission of sputtered secondary ions. Recent experiments, however, have suggested that the emission of positive ions of electronegative adsorbates can result from electronic processes rather than from processes involving elastic collisions. This dissertation presents the results of experiments studying the emission of positive oxygen ions from oxygen- and carbon-monoxide-covered transition metal surfaces during bombardment by 25-250 keV ions of neon, argon, and krypton. The systems studied may be grouped into four categories. For a nickel substrate with adsorbed oxygen, the emission of positive oxygen ions proceeds through collision cascades. For titanium and niobium with adsorbed oxygen, the emission of positive oxygen ions is proportional to the primary ion velocity, consistent with emission from electronic processes; for a given primary ion velocity, the oxygen ion yield is independent of primary ion species. For substrates of molybdenum and tungsten, the oxygen yield is proportional to primary ion velocity, but the yield also depends on the primary ion species for a given primary ion velocity in a manner that is consistent with emission resulting from electronic processes. For these two groups, except for titanium, the yields during neon ion bombardment do not extrapolate (assuming linearity with primary ion velocity) to a nonzero value at zero beam velocity. The magnitude of the oxygen ion yields from these targets is not consistent with that expected if the emission were induced by secondary electrons emitted during the ion bombardment

Hydrolysis of VX on concrete: rate of degradation by direct surface interrogation using an ion trap secondary ion mass spectrometer.

Science.gov (United States)

Groenewold, Gary S; Williams, John M; Appelhans, Anthony D; Gresham, Garold L; Olson, John E; Jeffery, Mark T; Rowland, Brad

2002-11-15

The nerve agent VX (O-ethyl S-2-diisopropylaminoethyl methylphosphonothiolate) is lethal at very low levels of exposure, which can occur by dermal contact with contaminated surfaces. Hence, behavior of VX in contact with common urban or industrial surfaces is a subject of acute interest. In the present study, VX was found to undergo complete degradation when in contact with concrete surfaces. The degradation was directly interrogated at submonolayer concentrations by periodically performing secondary ion mass spectrometry (SIMS) analyses after exposure of the concrete to VX. The abundance of the [VX + H]+ ion in the SIMS spectra was observed to decrease in an exponential fashion, consistent with first-order or pseudo-first-order behavior. This phenomenon enabled the rate constant to be determined at 0.005 min(-1) at 25 degrees C, which corresponds to a half-life of about 3 h on the concrete surface. The decrease in [VX + H]+ was accompanied by an increase in the abundance of the principal degradation product diisopropylaminoethanethiol (DESH), which arises by cleavage of the P-S bond. Degradation to form DESH is accompanied by the formation of ethyl methylphosphonic acid, which is observable only in the negative ion spectrum. A second degradation product was also implicated, which corresponded to a diisopropylvinylamine isomer (perhaps N,N-diisopropyl aziridinium) that arose via cleavage of the S-C bond. No evidence was observed for the formation of the toxic S-2-diisopropylaminoethyl methylphosphonothioic acid. The degradation rate constants were measured at four different temperatures (24-50 degrees C), which resulted in a linear Arrhenius relationship and an activation energy of 52 kJ mol(-1). This value agrees with previous values observed for VX hydrolysis in alkaline solutions, which suggests that the degradation of submonolayer VX is dominated by alkaline hydrolysis within the adventitious water film on the concrete surface.

Partial and total electronic stopping cross sections of atoms for a singly charged helium ion, Part 2

International Nuclear Information System (INIS)

Kaneko, T.; Nishikori, M.; Yamato, N.

1991-08-01

Partial and total electronic stopping cross sections of atoms with Z (55 ≤ Z ≤ 92) for a He + ion are tabulated as the second part of NIFS-DATA-11 (1991) on the basis of the wave-packet theory. (author)

Applications of the ion microprobe to geochemistry and cosmochemistry

International Nuclear Information System (INIS)

Shimizu, N.; Hart, S.R.

1982-01-01

When a solid surface is subjected to a bombardment of energetic ions, material is ejected from the surface in a process known as sputtering. A part of the sputtered material is ionized and these secondary ions can be analyzed with a mass spectrometer according to a technique known as secondary ion mass spectrometry (SIMS). A description is presented of the present status of geochemical and cosmochemical applications of the ion microprobe. Attention is given to the sputtering event, molecular ion interferences, aspects of isotopic fractionation, secondary ion intensities in polycomponent materials, and questions of trace element analysis. Geochemical applications of the ion microprobe are based on certain advantages over other analytical techniques. These advantages are related to high sensitivity, low background, and the capability of in situ analysis of isotopic composition. The distribution of trace elements in minerals is considered, along with isotope anomalies, isotope zoning, diffusion studies, and depth profiling

Experimental study of the organic ion intensity distribution in the ion imaging of coated polymer fibres with S-SIMS

International Nuclear Information System (INIS)

Vercammen, Yannick; Moons, Nicola; Van Nuffel, Sebastiaan; Beenaerts, Linda; Van Vaeck, Luc

2013-01-01

Time-of-Flight Static Secondary Ion Mass Spectrometry excels in probing the molecular composition of the outer monolayer of flat samples with a lateral resolution in the sub-μm range. However, the method faces significant methodological problems in the case of non-conducting samples with high topography or surface curvature, such as fibres, yarns or fabrics. Specifically, the useful secondary ion yield in a given spot on the fibre depends on the local incidence angle, the height above the earthed sample holder, the position relative to the axis of the mass analyser and the extent of the local surface charging. This study has focused on the empiric reduction of the useful ion yield variations observed in the ion images of fibres with diameter of 25 and 100 μm. Up to now, most literature data consider the analysis of fibres positioned along or perpendicular to the projection of the projectile beam in the plane of the sample surface because these specific geometries facilitate the interpretation of the ion images. However, it has been discovered that the diagonal orientation of the fibre in the field-of-view largely reduces the ion yield variations for fibres with a small diameter (25 μm). The situation is different for fibres with a diameter of 100 μm. In that case, the ion images contain no secondary ion counts for the pixels referring to a significant part of the fibre. In particular, the resulting lack of delineation between the shadow zone in the front of the fibre and the boundary of the fibre hampers the practical use of the ion images A fourfold decrease of the extraction voltage or a 20% increase of the distance between sample holder and extraction electrode is found to improve the detection of secondary ions from the part of the fibre facing towards the impinging primary ion beam. These observations have been tentatively related to the mass analyser acceptance and its dependence on the delicate balance between conflicting effects such as field strength

Secondary beams and the synthesis of exotic nuclei

International Nuclear Information System (INIS)

Nitschke, J.M.

1985-09-01

With the advent of modern fast cycling synchrotrons capable of delivering high intensity heavy ion beams up to uranium, the production of secondary radioactive ion beams (RIBs) with sufficient intensity has become feasible. The basic production mechanism is the fragmentation of near relativistic heavy ion beams on light targets. The physical facts underlying the efficient conversion of stable beams into RIBs are: (1) at beam energies of several 100 MeV/A thick conversion targets (1 to 10 g/cm 2 ) can be used, which, for nuclei near stability, convert on the order of .1 to 1% of the primary beam into secondary beams, (2) the secondary beams are emitted into a narrow phase space (small transverse and longitudinal emittances), and (3) these emittances are of the correct magnitude to match the acceptances of suitably designed storage and accumulator rings. 14 refs

Resistivity analysis of epitaxially grown, doped semiconductors using energy dependent secondary ion mass spectroscopy

International Nuclear Information System (INIS)

Burnham, Shawn D.; Thomas, Edward W.; Doolittle, W. Alan

2006-01-01

A characterization technique is discussed that allows quantitative optimization of doping in epitaxially grown semiconductors. This technique uses relative changes in the host atom secondary ion (HASI) energy distribution from secondary ion mass spectroscopy (SIMS) to indicate relative changes in conductivity of the material. Since SIMS is a destructive process due to sputtering through a film, a depth profile of the energy distribution of sputtered HASIs in a matrix will contain information on the conductivity of the layers of the film as a function of depth. This process is demonstrated with Mg-doped GaN, with the Mg flux slowly increased through the film. Three distinct regions of conductivity were observed: one with Mg concentration high enough to cause compensation and thus high resistivity, a second with moderate Mg concentration and low resistivity, and a third with little to no Mg doping, causing high resistivity due to the lack of free carriers. During SIMS analysis of the first region, the energy distributions of sputtered Ga HASIs were fairly uniform and unchanging for a Mg flux above the saturation, or compensation, limit. For the second region, the Ga HASI energy distributions shifted and went through a region of inconsistent energy distributions for Mg flux slightly below the critical flux for saturation, or compensation. Finally, for the third region, the Ga HASI energy distributions then settled back into another fairly unchanging, uniform pattern. These three distinct regions were analyzed further through growth of Mg-doped step profiles and bulk growth of material at representative Mg fluxes. The materials grown at the two unchanging, uniform regions of the energy distributions yielded highly resistive material due to too high of Mg concentration and low to no Mg concentration, respectively. However, material grown in the transient energy distribution region with Mg concentration between that of the two highly resistive regions yielded low

Resistivity analysis of epitaxially grown, doped semiconductors using energy dependent secondary ion mass spectroscopy

Science.gov (United States)

Burnham, Shawn D.; Thomas, Edward W.; Doolittle, W. Alan

2006-12-01

A characterization technique is discussed that allows quantitative optimization of doping in epitaxially grown semiconductors. This technique uses relative changes in the host atom secondary ion (HASI) energy distribution from secondary ion mass spectroscopy (SIMS) to indicate relative changes in conductivity of the material. Since SIMS is a destructive process due to sputtering through a film, a depth profile of the energy distribution of sputtered HASIs in a matrix will contain information on the conductivity of the layers of the film as a function of depth. This process is demonstrated with Mg-doped GaN, with the Mg flux slowly increased through the film. Three distinct regions of conductivity were observed: one with Mg concentration high enough to cause compensation and thus high resistivity, a second with moderate Mg concentration and low resistivity, and a third with little to no Mg doping, causing high resistivity due to the lack of free carriers. During SIMS analysis of the first region, the energy distributions of sputtered Ga HASIs were fairly uniform and unchanging for a Mg flux above the saturation, or compensation, limit. For the second region, the Ga HASI energy distributions shifted and went through a region of inconsistent energy distributions for Mg flux slightly below the critical flux for saturation, or compensation. Finally, for the third region, the Ga HASI energy distributions then settled back into another fairly unchanging, uniform pattern. These three distinct regions were analyzed further through growth of Mg-doped step profiles and bulk growth of material at representative Mg fluxes. The materials grown at the two unchanging, uniform regions of the energy distributions yielded highly resistive material due to too high of Mg concentration and low to no Mg concentration, respectively. However, material grown in the transient energy distribution region with Mg concentration between that of the two highly resistive regions yielded low

The combined measurement of uranium by alpha spectrometry and secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Harvan, D.

2009-01-01

The aim of thesis was to found the dependence between radiometric method - alpha spectrometry and surface sensitive method - Secondary Ion Mass Spectrometry (SIMS). Uranium or naturally occurring uranium isotopes were studied. Samples (high polished stainless steel discs) with uranium isotopes were prepared by electrodeposition. Samples were measured by alpha spectrometry after electrodeposition and treatment. It gives surface activities. Weights, as well as surface's weights of uranium isotopes were calculated from their activities, After alpha spectrometry samples were analyzed by TOF-SIMS IV instrument in International Laser Centre in Bratislava. By the SIMS analysis intensities of uranium-238 were obtained. The interpretation of SIMS intensities vs. surface activity, or surface's weights of uranium isotopes indicates the possibility to use SIMS in quantitative analysis of surface contamination by uranium isotopes, especially 238 U. (author)

An investigation of liquid secondary ion and laser desorption mass spectroscopy for the analysis of planar chromatograms

Energy Technology Data Exchange (ETDEWEB)

Dunphy, J.C.

1990-11-01

In the work described in this dissertation, interfaces between two mass spectrometric methods, liquid secondary ion mass spectrometry (LSIMS) and laser desorption/ionization Fourier transform mass spectrometry (LD/FTMS), and thin-layer chromatography (TLC) and slab gel electrophoresis were developed for bioanalytical applications. In an investigation of direct LSIMS for TLC analysis (TLC/LSIMS), mass spectra of bile acids and bile salts were characterized directly from high-performance TLC plates. The scanning ability of the LSIMS instrument was used to generate spatial profiles of the characteristic bile acid ions in the mass spectra. A procedure for the analysis of bile salts in dog bile was developed involving an extraction step, followed by TLC separation and direct TLC/LSIMS detection and semi-quantitation. For peptides, an experiment called selected-sequence monitoring'' was developed to locate target peptides related in structure in complex mixtures developed on TLC plates. Ions characteristic of the bradykinin and enkephalin peptides were used to generate spatial profiles of members of those peptide families on TLC plates. Using a Fourier transform mass spectrometer (FTMS), a fundamental investigation was conducted into the factors affecting the quality of analytical data obtained using direct laser desorption/ionization to produce mass spectra from TLC plates.

Spectroscopy of multi-charged ions: a short review

International Nuclear Information System (INIS)

Berry, H.G.

1983-01-01

Recent and future applications of multiply charged ions to spectroscopy and atomic structure are discussed. The experimental techniques use either very fast ions produced in heavy ion accelerators, or slow ions produced directly both in electron beam ion sources and from collisions of fast accelerated ions. For the accelerated fast ions, spectroscopic measurements on using gas target excitation, solid foil excitation and laser excitation. In gas target excitation, both X-ray and electron spectroscopy have been applied to analyse atomic structures and secondary collision effects. Highlycharged secondary ions have also been trapped electro-magnetically for further similar studies in controlled conditions. Spectroscopic detection following solid foil interaction has led to atomic lifetime measurements, principally of metastable level, analysis of complex highly-ionized heavy ion spectra, and investigations of relativistic and QED effects in few electron ions

The collision of a hypervelocity massive projectile with free-standing graphene: Investigation of secondary ion emission and projectile fragmentation

Science.gov (United States)

Geng, Sheng; Verkhoturov, Stanislav V.; Eller, Michael J.; Della-Negra, Serge; Schweikert, Emile A.

2017-02-01

We present here the study of the individual hypervelocity massive projectiles (440-540 keV, 33-36 km/s Au4004+ cluster) impact on 1-layer free-standing graphene. The secondary ions were detected and recorded separately from each individual impact in the transmission direction using a time-of-flight mass spectrometer. We observed C1-10± ions emitted from graphene, the projectiles which penetrated the graphene, and the Au1-3± fragment ions in mass spectra. During the projectile-graphene interaction, the projectile loses ˜15% of its initial kinetic energy (˜0.18 keV/atom, 72 keV/projectile). The Au projectiles are neutralized when approaching the graphene and then partially ionized again via electron tunneling from the hot rims of the holes on graphene, obtaining positive and negative charges. The projectile reaches an internal energy of ˜450-500 eV (˜4400-4900 K) after the impact and then undergoes a ˜90-100 step fragmentation with the ejection of Au1 atoms in the experimental time range of ˜0.1 μs.

Power consumption in positive ion beam converter with electrostatic electron suppressor

International Nuclear Information System (INIS)

Hashimoto, Kiyoshi; Sugawara, Tohru

1985-01-01

The power recovery characteristics of an in-line direct beam converter provided with electrostatic electron suppressor were studied numerically by tracing the orbits of fast primary ions and secondary charged particles generated along their beam path by collision with background gas molecules. It is shown that, in reference to the electrostatic field potential at the point of impact, the energy distribution of secondary ions impinging on the suppressor has two peaks-one corresponding to a zone of high positive potential surrounding the collector and the other to one of slightly negative potential around the electron suppressor. Secondary electron emission from the suppressor is ascribed mainly to the latter peak, associated with impingement of slower secondary ions. Far much power consumed in secondary particle acceleration is spent for emitting electrons from the suppressor than for secondary ions generated by beam-gas collision. The upper limit of background pressure is discussed on the basis of criteria prescribed for restricting the power consumed in this secondary particle acceleration, as for practical convenience of electrode cooling. Numerical examples are given of calculations based on particle trajectory analysis of both primary ions and secondary particles, for the case of a 100 keV-proton sheet beam 10 cm thick of 35 mA/cm 2 current density. (author)

High-energy acceleration of an intense negative ion beam

International Nuclear Information System (INIS)

Takeiri, Y.; Ando, A.; Kaneko, O.

1995-02-01

A high-current H - ion beam has been accelerated with the two-stage acceleration. A large negative hydrogen ion source with an external magnetic filter produces more than 10 A of the H - ions from the grid area of 25cm x 50cm with the arc efficiency of 0.1 A/kW by seeding a small amount of cesium. The H - ion current increases according to the 3/2-power of the total beam energy. A 13.6 A of H - ion beam has been accelerated to 125 keV at the operational gas pressure of 3.4 mTorr. The optimum beam acceleration is achieved with nearly the same electric fields in the first and the second acceleration gaps on condition that the ratio of the first acceleration to the extraction electric fields is adjusted for an aspect ratio of the extraction gap. The ratio of the acceleration drain current to the H - ion current is more than 1.7. That is mainly due to the secondary electron generated by the incident H - ions on the extraction grid and the electron suppression grid. The neutralization efficiency was measured and agrees with the theoretical calculation result. (author)

Total hip replacement with a superolateral bone graft for osteoarthritis secondary to dysplasia: a long-term follow-up

NARCIS (Netherlands)

de Jong, P. T.; Haverkamp, D.; van der Vis, H. M.; Marti, R. K.

2006-01-01

We evaluated the long-term results of 116 total hip replacements with a superolateral shelfplasty in 102 patients with osteoarthritis secondary to developmental dysplasia of the hip. After a mean follow-up of 19.5 years (11.5 to 26.0), 14 acetabular components (12%) had been revised. The cumulative

Direct surface analysis of pesticides on soil, leaves, grass, and stainless steel by static secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Ingram, J.C.; Groenewold, G.S.; Appelhans, A.D.; Delmore, J.E.; Olson, J.E.; Miller, D.L. [Idaho National Engineering Lab., Idaho Falls, ID (United States)

1997-02-01

Direct surface analyses by static secondary ion mass spectrometry (SIMS) were performed for the following pesticides adsorbed on dandelion leaves, grass, soil, and stainless steel samples: alachlor, atrazine, captan, carbofuran, chlorpyrifos, chlorosulfuron, chlorthal-dimethyl, cypermethrin, 2,4-D, diuron, glyphosate, malathion, methomyl, methyl arsonic acid, mocap, norflurazon, oxyfluorfen, paraquat, temik, and trifluralin. The purpose of this study was to evaluate static SIMS as a tool for pesticide analysis, principally for use in screening samples for pesticides. The advantage of direct surface analysis compared with conventional pesticide analysis methods is the elimination of sample pretreatment including extraction, which streamlines the analysis substantially; total analysis time for SIMS analysis was ca. 10 min/sample. Detection of 16 of the 20 pesticides on all four substrates was achieved. Of the remaining four pesticides, only one (trifluralin) was not detected on any of the samples. The minimum detectable quantity was determined for paraquat on soil in order to evaluate the efficacy of using SIMS as a screening tool. Paraquat was detected at 3 pg/mm{sup 2} (c.a. 0.005 monolayers). The results of these studies suggest that SIMS is capable of direct surface detection of a range of pesticides, with low volatility, polar pesticides being the most easily detected. 25 refs., 2 figs., 2 tabs.

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Energy Technology Data Exchange (ETDEWEB)

Yang, Jing; Cui, Wanzhao, E-mail: cuiwanzhao@126.com; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-30

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Investigation of argon ion sputtering on the secondary electron emission from gold samples

International Nuclear Information System (INIS)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-01-01

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Metal ions diffusion through polymeric matrices: A total reflection X-ray fluorescence study

International Nuclear Information System (INIS)

Boeykens, S.; Caracciolo, N.; D'Angelo, M.V.; Vazquez, C.

2006-01-01

This work proposes the use of X-ray fluorescence with total reflection geometry to explore the metal ions transport in aqueous hydrophilic polymer solutions. It is centered in the study of polymer concentration influence on ion diffusion. This subject is relevant to various and diverse applications, such as drug controlled release, microbiologic corrosion protection and enhanced oil recovery. It is anticipated that diffusion is influenced by various factors in these systems, including those specific to the diffusing species, such as charge, shape, molecular size, and those related to the structural complexity of the matrix as well as any specific interaction between the diffusing species and the matrix. The diffusion of nitrate salts of Ba and Mn (same charge, different hydrodynamic radii) through water-swollen polymeric solutions and gels in the 0.01% to 1% concentration ranges was investigated. The measurements of the metal concentration were performed by TXRF analysis using the scattered radiation by the sample as internal standard. Results are discussed according to different physical models for solute diffusion in polymeric solutions

Ion induced high energy electron emission from copper

International Nuclear Information System (INIS)

Ruano, G.; Ferron, J.

2008-01-01

We present measurements of secondary electron emission from Cu induced by low energy bombardment (1-5 keV) of noble gas (He + , Ne + and Ar + ) and Li + ions. We identify different potential and kinetic mechanisms and find the presence of high energetic secondary electrons for a couple of ion-target combinations. In order to understand the presence of these fast electrons we need to consider the Fermi shuttle mechanism and the different ion neutralization efficiencies.

Integration of paper-based microarray and time-of-flight secondary ion mass spectrometry (ToF-SIMS) for parallel detection and quantification of molecules in multiple samples automatically.

Science.gov (United States)

Chu, Kuo-Jui; Chen, Po-Chun; You, Yun-Wen; Chang, Hsun-Yun; Kao, Wei-Lun; Chu, Yi-Hsuan; Wu, Chen-Yi; Shyue, Jing-Jong

2018-04-16

With its low-cost fabrication and ease of modification, paper-based analytical devices have developed rapidly in recent years. Microarrays allow automatic analysis of multiple samples or multiple reactions with minimal sample consumption. While cellulose paper is generally used, its high backgrounds in spectrometry outside of the visible range has limited its application to be mostly colorimetric analysis. In this work, glass-microfiber paper is used as the substrate for a microarray. The glass-microfiber is essentially chemically inert SiO x , and the lower background from this inorganic microfiber can avoid interference from organic analytes in various spectrometers. However, generally used wax printing fails to wet glass microfibers to form hydrophobic barriers. Therefore, to prepare the hydrophobic-hydrophilic pattern, the glass-microfiber paper was first modified with an octadecyltrichlorosilane (OTS) self-assembled monolayer (SAM) to make the paper hydrophobic. A hydrophilic microarray was then prepared using a CO 2 laser scriber that selectively removed the OTS layer with a designed pattern. One microliter of aqueous drops of peptides at various concentrations were then dispensed inside the round patterns where OTS SAM was removed while the surrounding area with OTS layer served as a barrier to separate each drop. The resulting specimen of multiple spots was automatically analyzed with a time-of-flight secondary ion mass spectrometer (ToF-SIMS), and all of the secondary ions were collected. Among the various cluster ions that have developed over the past decade, pulsed C 60 + was selected as the primary ion because of its high secondary ion intensity in the high mass region, its minimal alteration of the surface when operating within the static-limit and spatial resolution at the ∼μm level. In the resulting spectra, parent ions of various peptides (in the forms [M+H] + and [M+Na] + ) were readily identified for parallel detection of molecules in a mixture

Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding

Science.gov (United States)

Beainy, Georges; Cerba, Tiphaine; Bassani, Franck; Martin, Mickaël; Baron, Thierry; Barnes, Jean-Paul

2018-05-01

Time of flight secondary ion mass spectrometry (ToF-SIMS) is a well-adapted analytical method for the chemical characterization of concentration profiles in layered or multilayered materials. However, under ion beam bombardment, initially smooth material surface becomes morphologically unstable. This leads to abnormal secondary ion yields and depth profile distortions. In this contribution, we explore the surface topography and roughening evolution induced by O2+ ion bombardment on GaSb/InAs multilayers. We demonstrate the formation of nanodots and ripples patterning according to the ion beam energy. Since the latter are undesirable for ToF-SIMS analysis, we managed to totally stop their growth by using simultaneously sample rotation and oxygen flooding. This unprecedented coupling between these two latter mechanisms leads to a significant enhancement in depth profiles resolution.

Application of Titanium Compounds to Reduce Fluoride Ion in Water Resources with High Fluoride Ion Contents

Directory of Open Access Journals (Sweden)

Fariborz Riahi

2005-06-01

Full Text Available The present work describes studies on the sorption of fluoride ions from water by titanium compounds used in water treatment to reduce fluoride content in water resources. There are different methods of reducing fluoride ion in water, each associated with specific problems such as secondary contamination, environmental contamination, high costs, or the need for primary and secondary treatment. In this study, application of titanium sulfate and Metatitanic acid produced from titanium ore concentrate (ileminite is investigated in the removal of fluoride ion and the possibility of complete purification of fluorine containing wastewater is examined to determine the optimal conditions. Metatitanic acid has a great sorption property for fluoride ion. Also titanium sulfate is a suitable and more effective material for this purpose. Efficiency of this material in reducing fluoride ion content is 99.9% and it is possible to refresh sorbet material for reuse without problems arising from Ti+4 ion contamination.

Total binding energy of heavy positive ions including density treatment of Darwin and Breit corrections

International Nuclear Information System (INIS)

Hill, S.H.; Grout, P.J.; March, N.H.

1987-01-01

Previous work on the relativistic Thomas-Fermi treatment of total energies of neutral atoms is first generalised to heavy positive ions. To facilitate quantitative contact with the numerical predictions of Dirac-Fock theory, Darwin and Breit corrections are expressed in terms of electron density, and computed using input again from relativistic Thomas-Fermi theory. These corrections significantly improve the agreement between the two seemingly very different theories. (author)

Secondary-ion mass spectrometry: some applications in the analysis of nuclear material

International Nuclear Information System (INIS)

Christie, W.H.; Eby, R.E.; Warmack, R.J.; Landau, L.

1981-01-01

Secondary ion mass spectrometry (SIMS) has been shown to offer some significant advantages over conventional mass spectrometry for the analysis of radioactive samples. We have used SIMS for the rapid, accurate analysis of B, Li, Cs, U and Pu in various nuclear materials. In many instances, SIMS allows one to perform mass and isotopic analysis on samples that are not amenable to other mass spectrometric techniques (e.g., surface ionization, electron impact, etc.). The significant advantage that accrues from the use of SIMS for isotopic analysis of these materials is the cmplete elimination of any chemical sample preparation steps, and only sample dissolution is necessary for the application of isotope dilution methods for quantitative analysis. The high sensitivity of SIMS for B, Li, U and Pu makes it possible to analyze sufficiently small radioactive samples so that radiation is reduced to acceptable levels for safe handling. The precision of SIMS isotopic analysis for natural B samples is about 0.5% and is about 1% for natural Li samples

Secondary ion mass spectrometry and environment. SIMS as applied to the detection of stable and radioactive isotopes in marine organisms

International Nuclear Information System (INIS)

Chassard-Bouchaud, C.; Escaig, F.; Hallegot, P.

1984-01-01

Several marine species of economical interest, Crustacea (crabs and prawns) and Molluscs (common mussels and oysters) were collected from coastal waters of France: English Channel, Atlantic Ocean and Mediterranean Sea and of Japan. Microanalyses which were performed at the tissue and cell levels, using Secondary Ion Mass Spectrometry, revealed many contaminants; stable isotopes as well as radioactive actinids such as uranium were detected. Uptake, storage and excretion target organs were identified [fr

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Cumpson, Peter J.; Portoles, Jose F.; Barlow, Anders J.; Sano, Naoko [National EPSRC XPS User' s Service (NEXUS), School of Mechanical and Systems Engineering, Newcastle University, Newcastle upon Tyne, NE1 7RU (United Kingdom)

2013-09-28

Argon Gas Cluster-Ion Beam sources are likely to become widely used on x-ray photoelectron spectroscopy and secondary ion mass spectrometry instruments in the next few years. At typical energies used for sputter depth profiling the average argon atom in the cluster has a kinetic energy comparable with the sputter threshold, meaning that for the first time in practical surface analysis a quantitative model of sputter yields near threshold is needed. We develop a simple equation based on a very simple model. Though greatly simplified it is likely to have realistic limiting behaviour and can be made useful for estimating sputter yields by fitting its three parameters to experimental data. We measure argon cluster-ion sputter yield using a quartz crystal microbalance close to the sputter threshold, for silicon dioxide, poly(methyl methacrylate), and polystyrene and (along with data for gold from the existing literature) perform least-squares fits of our new sputter yield equation to this data. The equation performs well, with smaller residuals than for earlier empirical models, but more importantly it is very easy to use in the design and quantification of sputter depth-profiling experiments.

Secondary Electrons from Water Vapor with the Impact of 6.0 MeV/u He2+ Ions: Atomic Data and their Application to Biomedical Investigations

International Nuclear Information System (INIS)

Sato, Y.; Soga, F.; Ohsawa, D.; Higashi, A.; Kawauchi, H.; Hirabayashi, M.; Okada, Y.; Uehara, S.; Nikjoo, H.

2005-01-01

We measured the energy and angular distributions (7 eV-10 keV and 20 degree sign -160 degree sign ) of secondary electrons produced in collisions of 6.0 MeV/u He2+ ions with water vapor. Binary-encounter collision peaks were clearly observed at the calculated energies at angles of 3keV. To assess the new cross sections, these values were incorporated in the kurbuc Monte-Carlo track structure code system for a simulation of secondary electrons. Radial dose distributions for 6.0 MeV/u He2+ ions were obtained by analyzing the tracks generated by the code kurbuc using the new DDCS values. In the core with a radius (r) of less than 1 nm, the dose is very high due mainly to excitation events, induced by low-energy electrons. The penumbra shows a well-known r-2 dependence

Stoichiometric carbon nitride synthesized by ion beam sputtering and post nitrogen ion implantation

International Nuclear Information System (INIS)

Valizadeh, R.; Colligon, J.S.; Katardiev, I.V.; Faunce, C.A.; Donnelly, S.E.

1998-01-01

Full text: Carbon nitride films have been deposited on Si (100) by ion beam sputtering a vitreous graphite target with nitrogen and argon ions with and without concurrent N2 ion bombardment at room temperature. The sputtering beam energy was 1000 eV and the assisted beam energy was 300 eV with ion / atom arrival ratio ranging from 0.5 to 5. The carbon nitride films were deposited both as single layer directly on silicon substrate and as multilayer between two layers of stoichiometric amorphous silicon nitride and polycrystalline titanium nitride. The deposited films were implanted ex-situ with 30 keV nitrogen ions with various doses ranging from 1E17 to 4E17 ions.cm -2 and 2 GeV xenon ion with a dose of 1E12 ions.cm -2 . The nitrogen concentration of the films was measured with Rutherford Backscattering (RBS), Secondary Neutral Mass Spectrometry (SNMS) and Parallel Electron Energy Loss Spectroscopy (PEELS). The nitrogen concentration for as deposited sample was 34 at% and stoichiometric carbon nitride C 3 N 4 was achieved by post nitrogen implantation of the multi-layered films. Post bombardment of single layer carbon nitride films lead to reduction in the total nitrogen concentration. Carbon K edge structure obtained from PEELS analysis suggested that the amorphous C 3 N 4 matrix was predominantly sp 2 bonded. This was confirmed by Fourier Transforrn Infra-Red Spectroscopy (FTIR) analysis of the single CN layer which showed the nitrogen was mostly bonded with carbon in nitrile (C≡N) and imine (C=N) groups. The microstructure of the film was determined by Transmission Electron Microscopy (TEM) which indicated that the films were amorphous

Effect of heating on the behaviors of hydrogen in C-TiC films with auger electron spectroscopy and secondary ion mass spectroscopy analyses

International Nuclear Information System (INIS)

Zou, Y.; Wang, L.W.; Huang, N.K.

2007-01-01

C-TiC films with a content of 75% TiC were prepared with magnetron sputtering deposition followed by Ar + ion bombardment. Effect of heating on the behaviors of hydrogen in C-TiC films before and after heating was studied with Auger Electron Spectroscopy and Secondary Ion Mass Spectroscopy (SIMS) analyses. SIMS depth profiles of hydrogen after H + ion implantation and thermal treatment show different hydrogen concentrations in C-TiC coatings and stainless steel. SIMS measurements show the existence of TiH, TiH 2 , CH 3 , CH 4 , C 2 H 2 bonds in the films after H + ion irradiation and the changes in the Ti LMM, Ti LMV and C KLL Auger line shape reveal that they have a good hydrogen retention ability after heating up to the temperature 393 K. All the results show that C-TiC coatings can be used as a hydrogen retainer or hydrogen permeable barrier on stainless steel to protect it from hydrogen brittleness

Ion induced high energy electron emission from copper

Energy Technology Data Exchange (ETDEWEB)

Ruano, G. [Instituto de Desarrollo Tecnologico para la Industria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina)], E-mail: gdruano@ceride.gov.ar; Ferron, J. [Instituto de Desarrollo Tecnologico para la Industria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina); Departamento de Ingenieria de Materiales, Facultad de Ingenieria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina)

2008-11-15

We present measurements of secondary electron emission from Cu induced by low energy bombardment (1-5 keV) of noble gas (He{sup +}, Ne{sup +} and Ar{sup +}) and Li{sup +} ions. We identify different potential and kinetic mechanisms and find the presence of high energetic secondary electrons for a couple of ion-target combinations. In order to understand the presence of these fast electrons we need to consider the Fermi shuttle mechanism and the different ion neutralization efficiencies.

Ion - biomolecule interactions and radiation damage

International Nuclear Information System (INIS)

Schlathoelter, T.

2004-01-01

Full text: The biological effects of ionizing radiation in living cells are not a mere result of the direct impact of high energy quanta of radiation. Secondary particles such as low energy electrons, radicals and (multiply charged) ions are formed within the track. The interaction of these secondary particles with biologically relevant molecules is responsible for a large fraction of biological radiation damage to a cell, as well. Singly and multiply charged ions can be of importance as both, primary and secondary particles, and are known to cause severe biological damage. For instance, in heavy ion therapy and proton therapy the pronounced Bragg peak of fast (typically a few 100 MeV/u) ions in biological tissue is utilized. The Bragg peak is located at a depth, where the ions (mostly C q+ or protons) are slowed down to about 100 keV/u and have their maximum linear energy transfer (LET) to the medium. This depth is reasonably well defined and depends on the initial ion kinetic energy. Since the ions are rapidly stopped in this energy range, penetration beyond the Bragg peak is weak and it is thus possible to 'scan' the Bragg peak through a malignant tumour without excessive damage of the surrounding tissue by mere variation of the ion kinetic energy (i.e. the penetration depth). Severe biological damage is almost only possible, when the track of a primary quantum of ionizing radiation crosses the nucleus of a cell. Particularly the induction of double strand breaks of DNA or clustered DNA lesions is potentially lethal or mutagenic. A primary particle interacting with individual molecules within this environment leads to molecular excitation, ionization and fragmentation. In the process, the primary particle looses energy and slow secondary electrons and ions are formed, which might induce further damage. For a deep understanding of biological radiation damage on the level of individual molecules it is thus important to quantify excitation, ionization and

Universal trend for heavy-ion total reaction cross sections at energies above the Coulomb barrier

International Nuclear Information System (INIS)

Tavares, O.A.P.; Medeiros, E.L.; Morcelle, V.

2010-06-01

Heavy-ion total reaction cross section measurements for more than one thousand one hundred reaction cases covering 61 target nuclei in the range 6 Li- 238 U, and 158 projectile nuclei from 2 H up to 84 Kr (mostly exotic ones) have been analysed in a systematic way by using an empirical, three-parameter formula which is applicable to cases for projectile kinetic energies above the Coulomb barrier. The analysis has shown that the average total nuclear binding energy per nucleon of the interacting nuclei and their radii are the chief quantities which describe the cross section patterns. A great number of cross section data (87%) has been quite satisfactorily reproduced by the proposed formula, therefore total reaction cross section predictions for new, not yet experimentally investigated reaction cases can be obtained within 25 percent (or much less) of uncertainty (author)

Electron and ion currents relevant to accurate current integration in MeV ion backscattering spectrometry

International Nuclear Information System (INIS)

Matteson, S.; Nicolet, M.A.

1979-01-01

The magnitude and characteristics of the currents which flow in the target and the chamber of an MeV ion backscattering spectrometer are examined. Measured energy distributions and the magnitude of high-energy secondary electron currents are reported. An empirical universal curve is shown to fit the energy distribution of secondary electrons for several combinations of ion energy, targets and ion species. The magnitude of tertiary electron currents which arise at the vacuum vessel walls is determined for various experimental situations and is shown to be non-negligible in many cases. An experimental arrangement is described which permits charge integrations to 1% arruracy without restricting access to the target as a Faraday cage does. (Auth.)

Charge transfer processes during ion scattering and stimulated desorption of secondary ions from gas-condensed dielectric surfaces

CERN Document Server

Souda, R

2002-01-01

The ion emission mechanism from weakly-interacting solid surfaces has been investigated. The H sup + ion captures a valence electron via transient chemisorption, so that the ion neutralization probability is related to the nature of bonding of adsorbates. The H sup + ion is scattered from physisorbed Ar at any coverage whereas the H sup + yield from solid H sub 2 O decays considerably due to covalency in the hydrogen bond. In electron- and ion-stimulated desorption, the ion ejection probability is correlated intimately with the physisorption/chemisorption of parent atoms or molecules. The emission of F sup + ions is rather exceptional because they arise from the screened F 2s core-hole state followed by the ionization via the intra-atomic Auger decay after bond breakage. In electron-stimulated desorption of H sub 2 O, hydrated protons are emitted effectively from nanoclusters formed on a solid Ar substrate due to Coulomb repulsion between confined valence holes.

Study of electron beam effects on surfaces using x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS)

International Nuclear Information System (INIS)

Gettings, M.; Coad, J.P.

1976-02-01

Discrepancies in the surface analyses of oxidised or heavily contaminated materials have been observed between X-ray Photoelectron Spectroscopy (XPS) and techniques using electron beams (primarily Auger Electron Spectroscopy (AES)). These discrepancies can be ascribed to the influence of the primary electron beam and to illustrate the various types of electron effects different materials were analysed using XPS and Secondary Ion Mass Spectroscopy (SIMS) before and after large area electron bombardment. The materials used included chrome and stainless steels, nickel, platinum, glass and brass. (author)

Modelling heavy-ion energy deposition in extended media

International Nuclear Information System (INIS)

Mishustin, I.; Pshenichnov, I.; Greiner, W.; Mishustin, I.; Pshenichnov, I.

2010-01-01

We present recent developments of the Monte Carlo model for heavy-ion therapy (MCHIT), which is currently based on the Geant4 tool-kit of version 9.2. The major advancement of the model concerns the modelling of violent fragmentation reactions by means of the Fermi break-up model, which is used to simulate decays of hot fragments created after the first stage of nucleus-nucleus collisions. By means of MCHIT we study the dose distributions from therapeutic beams of carbon nuclei in tissue-like materials, like water and PMMA. The contributions to the total dose from primary beam nuclei and from charged secondary fragments produced in nuclear fragmentation reactions are calculated. The build-up of secondary fragments along the beam axis is calculated and compared with available experimental data. Finally, we demonstrate the impact of violent multifragment decays on energy distributions of secondary neutrons produced by carbon nuclei in water. (authors)

Modelling heavy-ion energy deposition in extended media

Energy Technology Data Exchange (ETDEWEB)

Mishustin, I.; Pshenichnov, I.; Greiner, W. [Frankfurt Institute for Advanced Studies, J.-W. Goethe University, Frankfurt am Main (Germany); Mishustin, I. [Kurchatov Institute, Russian Research Center, Moscow (Russian Federation); Pshenichnov, I. [Institute for Nuclear Research, Russian Academy of Science, Moscow (Russian Federation)

2010-10-15

We present recent developments of the Monte Carlo model for heavy-ion therapy (MCHIT), which is currently based on the Geant4 tool-kit of version 9.2. The major advancement of the model concerns the modelling of violent fragmentation reactions by means of the Fermi break-up model, which is used to simulate decays of hot fragments created after the first stage of nucleus-nucleus collisions. By means of MCHIT we study the dose distributions from therapeutic beams of carbon nuclei in tissue-like materials, like water and PMMA. The contributions to the total dose from primary beam nuclei and from charged secondary fragments produced in nuclear fragmentation reactions are calculated. The build-up of secondary fragments along the beam axis is calculated and compared with available experimental data. Finally, we demonstrate the impact of violent multifragment decays on energy distributions of secondary neutrons produced by carbon nuclei in water. (authors)

Analytic properties of the relativistic Thomas-Fermi equation and the total energy of atomic ions

International Nuclear Information System (INIS)

March, N.H.; Senatore, G.

1985-06-01

The analytic properties of solutions of the relativistic Thomas-Fermi equation which tend to zero at infinity are first examined, the neutral atom solution being a member of this class. A new length is shown to enter the theory, proportional to the square root of the fine structure constant. This information is used to develop a perturbation expansion around the neutral atom solution, corresponding to positive atomic ions with finite but large radii. The limiting law relating ionic radius to the degree of ionization is thereby displayed in functional form, and solved explicitly to lowest order in the fine structure constant. To embrace this knowledge of heavy positive ions, as well as results from the one-electron Dirac equation, a proposal is then advanced as to the analytic form of the relativistic total energy E(Z,N) of an atomic ion with nuclear charge Ze and total number of electrons N. The fact that, for N>1, the nucleus is known only to bind Z+n electrons, where n is 1 or 2, indicates non-analyticity in the complex Z plane, represented by a circle of radius Z approx.= N. Such non-analyticity is also a property of the non-relativistic energy derived from the many-electron Schroedinger equation. The relativistic theory, however, must also embody a second type of non-analyticity associated with the known property for N=1 that the Dirac equation predicts electron-positron pair production when the electronic binding energy becomes equal to twice the electron rest mass energy. This corresponds to a second circle of non-analyticity in E(Z,N), and hence to a Taylor-Laurent expansion of this quantity in the atomic number Z. The relation of this expansion to the Layzer-Bahcall series is finally discussed. (author)

Analysis of supramolecular surface nanostructures using secondary ion mass spectrometry (poster)

International Nuclear Information System (INIS)

Halaszova, S.; Velic, D.

2013-01-01

Our system consists of host molecules β-cyclodextrin (C 42 H 70 O 35 ), of implemented Iron nanoparticles (guest). Whole supramolecular complex is placed on a gold substrate. In our project we work with monotiolated β-cyclodextrin (C 42 H 70 O 34 S), consisting of seven α-D-1-4 glucopyranose units. Cyclodextrins have been selected deliberately because of their ability to form inclusion complexes .They are also capable of forming structures similar to self-assembly monolayers. To study the formation of these supramolecular surface nanostructures mass secondary ion spectrometry is used. With this technique fragmentation of monotiolated β-cyclodextrin and the presence of the supramolecular complex on a gold surface can be examined. The observed fragments of monotiolated cyclodextrines films can be divided into three groups: Au X H Y S Z , fragments originating from cyclodextrin molecules associated with Au. Fragments as (C 42 H 70 O 34 S)Na + , (C 42 H 70 O 35 )Na + and (AuC 42 H 69 O 34 S)Na + were identified as well as fragments thereof in cationized form with K + . The main objective of the project is a detailed study and preparation of supramolecular nanostructures consisting of complex guest-host monotiolated β-cyclodextrin host-iron), and a gold substrate. (Authors)

Electron capture into excited states of multi-charged ions

International Nuclear Information System (INIS)

Dijkkamp, D.

1985-01-01

This thesis deals with charge exchange reactions in slow collisions of multi-charged ions with neutral atoms or molecules. These reactions proceed very efficiently via a curve crossing mechanism, which leads to preferential population of excited states of the ion. The subsequent decay of these states leads to the emission of characteristic radiation. From wavelength resolved measurements of the absolute intensity of this radiation, cross sections for selective population of the excited (n,l-) states of the ion were determined. In addition, for some systems the total capture cross section was measured directly by means of charge state analysis of the secondary projectile ions. The role of charge exchange processes in fusion plasmas and in astrophysical plasmas is indicated. An experimental set-up is described with emphasis on the Electron Cyclotron Resonance Ion Source that was used in the experiments. Results for collisions of C 6+ , N 6+ , O 6+ and Ne 6+ with He, H 2 and Ar are presented as well as for electron capture from Li atoms by C 4+ and He 2+ . The interaction of the iso-electronic sequence C 4+ , N 5+ , O 6+ with atomic hydrogen, molecular hydrogen and helium is studied. First results for partial and total cross sections in collisions of fully stripped carbon, nitrogen and oxygen ions with atomic hydrogen are presented. These data are of particular importance for applications in fusion diagnostics. The data indicate that calculations of both molecular and atomic orbital type yield correct results, if an extended basis set is used. (Auth.)

Universal trend for heavy-ion total reaction cross sections at energies above the Coulomb barrier

Energy Technology Data Exchange (ETDEWEB)

Tavares, O.A.P.; Medeiros, E.L., E-mail: emil@cbpf.b [Centro Brasileiro de Pesquisas Fisicas (CBPF), Rio de Janeiro, RJ (Brazil); Morcelle, V. [Universidade de Sao Paulo (IF/USP), SP (Brazil). Inst. de Fisica

2010-06-15

Heavy-ion total reaction cross section measurements for more than one thousand one hundred reaction cases covering 61 target nuclei in the range {sup 6}Li-{sup 238}U, and 158 projectile nuclei from {sup 2}H up to {sup 84}Kr (mostly exotic ones) have been analysed in a systematic way by using an empirical, three-parameter formula which is applicable to cases for projectile kinetic energies above the Coulomb barrier. The analysis has shown that the average total nuclear binding energy per nucleon of the interacting nuclei and their radii are the chief quantities which describe the cross section patterns. A great number of cross section data (87%) has been quite satisfactorily reproduced by the proposed formula, therefore total reaction cross section predictions for new, not yet experimentally investigated reaction cases can be obtained within 25 percent (or much less) of uncertainty (author)

Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis

International Nuclear Information System (INIS)

Ross, G.G.

1994-01-01

Only two techniques are really appropriate for the depth profiling of hydrogen isotopes: nuclear microanalysis (NMA) and secondary ion mass spectrometry (SIMS). The intent of this paper is to give an up to date review of both techniques and to show how they can be used in conjunction. Both techniques (SIMS and NMA) will be described briefly. NMA will divided into two different categories: nuclear reaction analysis (NRA) and elastic recoil detection (ERD). Both techniques (SIMS and NMA) will be discussed in terms of sensitivity, resolution, probing depth, quantitative measurement, generality and selectivity, beam induced effects and surface roughness effects. The principal advantages and disadvantages of each of these techniques will be specified, supporting the contention that SIMS and NMA are complementary and should be used in conjunction. Finally, some examples of, and perspectives for, the complementary use of both techniques will be presented. (Author)

Molecular imaging of in vivo calcium ion expression in area postrema of total sleep deprived rats: Implications for cardiovascular regulation by TOF-SIMS analysis

Science.gov (United States)

Mai, Fu-Der; Chen, Li-You; Ling, Yong-Chien; Chen, Bo-Jung; Wu, Un-In; Chang, Hung-Ming

2010-05-01

Excessive calcium influx in chemosensitive neurons of area postrema (AP) is detrimental for sympathetic activation and participates in the disruption of cardiovascular activities. Since total sleep deprivation (TSD) is a stressful condition known to harm the cardiovascular function, the present study is aimed to determine whether the in vivo calcium expression in AP would significantly alter following TSD by the use of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and calretinin (a specific calcium sensor protein in AP neurons) immunohistochemistry. The results indicated that in normal rats, the calcium intensity was estimated to be 0.5 × 10 5 at m/ z 40.08. However, following TSD, the intensity for calcium ions was greatly increased to 1.2 × 10 5. Molecular imaging revealed that after TSD, various strongly expressed calcium signals were distributed throughout AP with clear identified profiles instead of randomly scattered within this region in normal rats. Immunohistochemical staining corresponded well with ionic image in which a majority of calcium-enriched gathering co-localized with calretinin positive neurons. The functional significance of TSD-induced calcium augmentation was demonstrated by increased heart rate and mean arterial pressure, clinical markers for cardiovascular dysfunction. Considering AP-mediated sympathetic activation is important for cardiovascular regulation, exaggerated calcium influx in AP would render this neurocircuitry more vulnerable to over-excitation, which might serve as the underlying mechanism for the development of TSD-relevant cardiovascular deficiency.

Electron capture by highly charged low-velocity ions

International Nuclear Information System (INIS)

Cocke, C.L.; Dubois, R.; Justiniano, E.; Gray, T.J.; Can, C.

1982-01-01

This paper describes the use of a fast heavy ion beam to produce, by bombardment of gaseous targets, highly-charged low-velocity recoil ions, and the use of these secondary ions in turn as projectiles in studies of electron capture and ionization in low-energy collision systems. The interest in collisions involving low-energy highly-charged projectiles comes both from the somewhat simplifying aspects of the physics which attend the long-range capture and from applications to fusion plasmas, astrophysics and more speculative technology such as the production of X-ray lasers. The ions of interest in such applications should have both electronic excitation and center-of-mass energies in the keV range and cannot be produced by simply stripping fast heavy ion beams. Several novel types of ion source have been developed to produce low-energy highly-charged ions, of which the secondary ion recoil source discussed in this paper is one. (Auth.)

Electrically switched cesium ion exchange

International Nuclear Information System (INIS)

Lilga, M.A.; Orth, R.J.; Sukamto, J.P.H.; Schwartz, D.T.; Haight, S.M.; Genders, J.D.

1997-04-01

Electrically Switched Ion Exchange (ESIX) is a separation technology being developed as an alternative to conventional ion exchange for removing radionuclides from high-level waste. The ESIX technology, which combines ion exchange and electrochemistry, is geared toward producing electroactive films that are highly selective, regenerable, and long lasting. During the process, ion uptake and elution are controlled directly by modulating the potential of an ion exchange film that has been electrochemically deposited onto a high surface area electrode. This method adds little sodium to the waste stream and minimizes the secondary wastes associated with traditional ion exchange techniques. Development of the ESIX process is well underway for cesium removal using ferrocyanides as the electroactive films. Films having selectivity for perrhenate (a pertechnetate surrogate) over nitrate also have been deposited and tested. A case study for the KE Basin on the Hanford Site was conducted based on the results of the development testing. Engineering design baseline parameters for film deposition, film regeneration, cesium loading, and cesium elution were used for developing a conceptual system. Order of magnitude cost estimates were developed to compare with conventional ion exchange. This case study demonstrated that KE Basin wastewater could be processed continuously with minimal secondary waste and reduced associated disposal costs, as well as lower capital and labor expenditures

Interactions of relativistic heavy ions in thick heavy element targets and some unresolved problems

International Nuclear Information System (INIS)

Brandt, R.; Ditlov, V.A.; Pozharova, E.A.; Smirnitskij, V.A.

2005-01-01

Interactions of relativistic heavy ions with total energies above 30 GeV in thick Cu and Pb targets (≥2 cm) have been studied with various techniques. Radiochemical irradiation experiments using thick Cu targets, both in a compact form or as diluted '2π-Cu targets' have been carried out with several relativistic heavy ions, such as 44 GeV 12 C (JINR, Dubna) and 72 GeV 40 Ar (LBL, Berkeley, USA). Neutron measuring experiments using thick targets irradiated with various relativistic heavy ions up to 44 GeV 12 C have been performed at JINR. In addition, the number of 'black prongs' in nuclear interactions (due to protons with energies less than 30 MeV and emitted from the target-like interaction partner at rest) produced with 72 GeV 22 Ne ions in nuclear emulsion plates has been measured in the first nuclear interaction of the primary 22 Ne ion and in the following second nuclear interaction of the secondary heavy (Z>1) ion. Some essential results have been obtained. 1) Spallation products produced by relativistic secondary fragments in interactions ([44 GeV 12 C or 72 GeV 40 Ar]+Cu) within thick copper yield less products close to the target and much more products far away from the target as compared to primary beam interactions. This applies also to secondary particles emitted into large angles (Θ>10deg). 2) The neutron production of 44 GeV 12 C within thick Cu and Pb targets is beyond the estimated yield as based on experiments with 12 GeV 12 C. These rather independent experimental results cannot be understood with well-accepted nuclear reaction models. They appear to present unresolved problems

Secondary beams at GANIL

International Nuclear Information System (INIS)

Doubre, H.

1992-01-01

GANIL, a user's facility since 1983, can deliver a broad spectrum of heavy-ion beams, from He to U, to well-equipped experimental areas. Their very large intensities are to be exploited to produce secondary beams, either using the fragmentation method (beams at energy per nucleon larger than 30 MeV/u), or the ISOL method. With the latter one, these ions have to be re-accelerated. The project of a cyclotron as a post-accelerator is described. (author) 11 refs.; 7 figs.; 3 tabs

Simulation of temperature distribution in cylindrical and prismatic lithium ion secondary batteries

International Nuclear Information System (INIS)

Inui, Y.; Kobayashi, Y.; Watanabe, Y.; Watase, Y.; Kitamura, Y.

2007-01-01

The authors develop two-dimensional and three-dimensional simulation codes of the transient response of the temperature distribution in the lithium ion secondary battery during a discharge cycle. At first, a two-dimensional simulation code for a cylindrical battery is developed, and the simulation results for a commercially available small size battery are compared with the corresponding experimental results. The simulation results of the transient temperature and voltage variations coincide very well with the experimental results. The simulation result of the temperature difference between the center of the battery body and the center of the battery side is also in reasonable agreement with the experimental result. Next, the authors develop a three-dimensional simulation code and perform numerical simulations for three large size prismatic batteries with the same capacity and different cross sectional shapes. It is made clear that selecting the battery with the laminated cross section has a remarkable effect on the suppression of the temperature rise in comparison with the battery with square cross section, whereas the effect of the lamination on the suppression of the temperature unevenness is unexpectedly small. These results indicate the accuracy and usefulness of the developed simulation codes

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Evaluation of SG blowdown demineralizer performance by replacement of ammonia with ethanolamine as a PWR secondary pH control agent

Energy Technology Data Exchange (ETDEWEB)

Rhee, I.H. [Department of Materials and Chemical Engineering, Soonchunhyang Univ. (Korea, Republic of); Yim, S.J. [Operation Management Team, Korea Hydro and Nuclear Power Co. Ltd., Seoul (Korea, Republic of)

2002-07-01

Four Korean PWR plants have adopted ethanolamine (ETA) as a secondary pH control agent to increase the pH at the liquid phase, which raises the pH in the SG blowdown system. The run time of the SG blowdown demineralizer can be reduced by the increased number of ionic chemical species primarily due to ETA. Contrary to the possible prevention of SG degradation, the replacement of ammonia with ETA results in the water chemistry difficulties and more frequent generation of spent resin. A comprehensive experimental data set for binary, ternary, quaternary, and quinary cation and anion adsorption was developed from small-volume batch tests at total cation or anion concentrations of 0.01 and 0.05 N to obtain the selectivity coefficients of many cations and anions normally present in the PWR secondary system water. In addition, the kinetic study using the bench-scale column was performed to examine the breakthrough point of an ion and to calculate the ratio of inlet to outlet concentration at the column, so called Decontamination Factor, in the different background electrolyte. The batch equilibrium tests indicated that the ion selectivity is higher for an ion of higher valence and is not uniform in the different composition and ionic strength. The preference of an ion on ion exchange resin rather tends to be lower with higher ionic strength. The leakage of an ion from the ion exchange column is not also uniform in time in the various composition and total concentration. Therefore the ion selectivity and breakthrough time are different in ammonia and ethanolamine background electrolytes. The run time of SG blowdown demineralizer can be shorter than it can be expected due to the elevated ionic strength as well as the increased dissolved solids. The quantitative run time can be estimated by such ion exchange models as semi-empirical mass action and surface complexation models. The demineralizer can be used longer by increasing the ratios of cation to anion exchange resins in

Evaluation of SG blowdown demineralizer performance by replacement of ammonia with ethanolamine as a PWR secondary pH control agent

International Nuclear Information System (INIS)

Rhee, I.H.; Yim, S.J.

2002-01-01

Four Korean PWR plants have adopted ethanolamine (ETA) as a secondary pH control agent to increase the pH at the liquid phase, which raises the pH in the SG blowdown system. The run time of the SG blowdown demineralizer can be reduced by the increased number of ionic chemical species primarily due to ETA. Contrary to the possible prevention of SG degradation, the replacement of ammonia with ETA results in the water chemistry difficulties and more frequent generation of spent resin. A comprehensive experimental data set for binary, ternary, quaternary, and quinary cation and anion adsorption was developed from small-volume batch tests at total cation or anion concentrations of 0.01 and 0.05 N to obtain the selectivity coefficients of many cations and anions normally present in the PWR secondary system water. In addition, the kinetic study using the bench-scale column was performed to examine the breakthrough point of an ion and to calculate the ratio of inlet to outlet concentration at the column, so called Decontamination Factor, in the different background electrolyte. The batch equilibrium tests indicated that the ion selectivity is higher for an ion of higher valence and is not uniform in the different composition and ionic strength. The preference of an ion on ion exchange resin rather tends to be lower with higher ionic strength. The leakage of an ion from the ion exchange column is not also uniform in time in the various composition and total concentration. Therefore the ion selectivity and breakthrough time are different in ammonia and ethanolamine background electrolytes. The run time of SG blowdown demineralizer can be shorter than it can be expected due to the elevated ionic strength as well as the increased dissolved solids. The quantitative run time can be estimated by such ion exchange models as semi-empirical mass action and surface complexation models. The demineralizer can be used longer by increasing the ratios of cation to anion exchange resins in

Ion-induced secondary electron emission, optical and hydration resistant behavior of MgO, Mg–Mo–O and Mg–Ce–O thin films

International Nuclear Information System (INIS)

Kumar, Ashok; Thota, Subhash; Deva, Dinesh; Kumar, Jitendra

2014-01-01

Optical transmittance, hydration resistance and secondary electron emission characteristics of e-beam evaporated pure and Mo- or Ce-containing MgO thin films have been investigated. While the increased grain size and pyramidal columnar morphology following incorporation of molybdenum and cerium in MgO are responsible for the excellent discharge characteristics, emergence of neutral {100} and {110} MgO surfaces preferentially give rise to high optical transmittance (∼ 92–100%) and stability against hydration. Further, addition of Mo (or Ce) in MgO causes significant increase in defect density which, in turn, enhances the photoluminescence (PL) emission from 5-, 4- and 3-coordination sites. The changes lead to lowering of the breakdown voltage and hence improvement in the secondary electron emission (SEE) efficiency. These facts have been supported by ion-induced SEE yield (γ) deduced from the a.c. breakdown voltage observed, taking neon as a discharge gas, and determined semi-empirically as well with Hagstrum's theory based on Auger neutralization process using (i) band offset parameters and surface band gap data derived from X-ray photoelectron spectroscopy signal and (ii) information of defect energy levels obtained from photoluminescence (PL) measurements. The experimental values of neon ion-induced SEE yield (γ) are found to be 0.35, 0.42 and 0.39 for MgO, Mg–Mo–O (x = 0.035) and Mg–Ce–O (x = 0.01) thin films, respectively. - Highlights: • Higher hydration resistance • Increased photoluminescence emission • Higher secondary electron emission

Ion beam characteristics of the controlatron/zetatron family of the gas filled neutron tubes

Energy Technology Data Exchange (ETDEWEB)

Berg, R.S.; Shope, L.A.; O' Neal, M.L.; Boers, J.E.; Bickes, R.W. Jr.

1981-03-01

A gas filled tube used to produce a neutron flux with the D(T,He/sup 4/)n reaction is described. Deuterium and tritium ions generated in a reflex discharge are extracted and accelerated to 100 keV by means of an accelerator electrode onto a deutero-tritide target electrode. The electrodes are designed to focus the ion beam onto the target. Total tube currents consisting of extracted ions, unsuppressed secondary electrons, and ions generated by interactions with the background gas are typically 100 mA. The characteristics of the extracted ion beam are discussed. Accelerating voltages greater than 50 kV are required to focus the beam through the accelerator aperture for configurations that give beams with the proper energy density onto the target. The perveance of the beam is discussed. Maximum perveance values are 2 to 20 nanopervs. Tube focusing and neutron production characteristics are described.

A new setup for the investigation of swift heavy ion induced particle emission and surface modifications

Energy Technology Data Exchange (ETDEWEB)

Meinerzhagen, F.; Breuer, L.; Bukowska, H.; Herder, M.; Schleberger, M.; Wucher, A. [Fakultät für Physik, Universität Duisburg-Essen and Cenide, 47057 Duisburg (Germany); Bender, M.; Severin, D. [GSI Helmholtzzentrum für Schwerionenforschung GmbH, 64291 Darmstadt (Germany); Lebius, H. [CIMAP (CEA-CNRS-ENSICAEN-UCN), 14070 Caen Cedex 5 (France)

2016-01-15

The irradiation with fast ions with kinetic energies of >10 MeV leads to the deposition of a high amount of energy along their trajectory (up to several ten keV/nm). The energy is mainly transferred to the electronic subsystem and induces different secondary processes of excitations, which result in significant material modifications. A new setup to study these ion induced effects on surfaces will be described in this paper. The setup combines a variable irradiation chamber with different techniques of surface characterizations like scanning probe microscopy, time-of-flight secondary ion, and neutral mass spectrometry, as well as low energy electron diffraction under ultra high vacuum conditions, and is mounted at a beamline of the universal linear accelerator (UNILAC) of the GSI facility in Darmstadt, Germany. Here, samples can be irradiated with high-energy ions with a total kinetic energy up to several GeVs under different angles of incidence. Our setup enables the preparation and in situ analysis of different types of sample systems ranging from metals to insulators. Time-of-flight secondary ion mass spectrometry enables us to study the chemical composition of the surface, while scanning probe microscopy allows a detailed view into the local electrical and morphological conditions of the sample surface down to atomic scales. With the new setup, particle emission during irradiation as well as persistent modifications of the surface after irradiation can thus be studied. We present first data obtained with the new setup, including a novel measuring protocol for time-of-flight mass spectrometry with the GSI UNILAC accelerator.

Determination of the total concentration and speciation of metal ions in river, estuarine and seawater samples.

Science.gov (United States)

Alberti, Giancarla; Biesuz, Raffaela; Pesavento, Maria

2008-12-01

Different natural water samples were investigated to determine the total concentration and the distribution of species for Cu(II), Pb(II), Al(III) and U(VI). The proposed method, named resin titration (RT), was developed in our laboratory to investigate the distribution of species for metal ions in complex matrices. It is a competition method, in which a complexing resin competes with natural ligands present in the sample to combine with the metal ions. In the present paper, river, estuarine and seawater samples, collected during a cruise in Adriatic Sea, were investigated. For each sample, two RTs were performed, using different complexing resins: the iminodiacetic Chelex 100 and the carboxylic Amberlite CG50. In this way, it was possible to detect different class of ligands. Satisfactory results have been obtained and are commented on critically. They were summarized by principal component analysis (PCA) and the correlations with physicochemical parameters allowed one to follow the evolution of the metals along the considered transect. It should be pointed out that, according to our findings, the ligands responsible for metal ions complexation are not the major components of the water system, since they form considerably weaker complexes.

Outcomes of Total Parathyroidectomy with Autotransplantation versus Subtotal Parathyroidectomy with Routine Addition of Thymectomy to both Groups: Single Center Experience of Secondary Hyperparathyroidism

Directory of Open Access Journals (Sweden)

Cem Kaan Parsak

2014-03-01

Full Text Available Background: Secondary hyperparathyroidism is a common acquired disorder seen in chronic renal failure. It may result in potentially serious complications including metabolic bone diseases, severe atherosclerosis and undesirable cardiovascular events. Parathyroidectomy is required in about 20% of patients after 3-10 years of dialysis and in up to 40% after 20 years. Aims: The aim of the current study was to evaluate the short-term and long-term outcomes of patients with secondary hyperparathyroidism who had undergone total parathyroidectomy with autotransplantation and thymectomy or subtotal parathyroidectomy with thymectomy by the same surgical team during the study period. Study Design: Retrospective comparative study. Methods: Clinical data of 50 patients who underwent parathyroid surgery for secondary hyperparathyroidism between 2003 and 2011 were reviewed retrospectively. Patients were divided into two subgroups of total parathyroidectomy with autotransplantation or subtotal parathyroidectomy. Thymectomy was routinely performed for both groups. Short term outcome parameters included intact parathyroid hormone, ionized calcium and alkaline phosphatase levels. Bone pain, bone fractures, persistent or recurrent disease were included in long term outcome parameters. Results: The mean duration of dialysis was eight years. The mean ionized calcium levels dropped significantly in the total parathyroidectomy with autotransplantation group (p=0.016. No serious postoperative complications were observed. Postoperative intravenous calcium supplementation was required in four patients in the total parathyroidectomy with autotransplantation group (total PTX+AT and in three patients in the subtotal parathyroidectomy group (subtotal PTX. Postoperatively, all patients received oral calcium carbonate and calcitriol. The length of average hospital stay was 5 (3-10 days. Including nine patients who underwent successful renal transplantation pre-operative bone

Effect of total pressure on sulfur capture of Ca-ion exchanged coal; Kaatsu jokenka ni okeru Ca-tanjitan no datsuryu koka

Energy Technology Data Exchange (ETDEWEB)

Lin, S.; Benjamin, G.; Abe, H.; Harano, A.; Takarada, T. [Gunma University, Gunma (Japan). Faculty of Engineering

1996-10-28

In relation to coal gasification and combustion under high pressure as highly efficient coal utilization, the effect of total pressure and sintering on the SO2 capture ability of Ca-ion exchanged coal and other desulfurizing agents were studied. In experiment, specimens were filled into a small pressurized reactor to heat them under high-pressure N2 atmosphere. After the completion of combustion reaction of char at 850{degree}C, SO2, CO2 and CO gases were measured at an outlet while flowing SO2/N2. As the experimental result, all of the S content in Ca-ion exchanged coal was not absorbed by Ca content in coal during pyrolysis and combustion, resulting in discharge of 36% of the S content. Since Ca-ion exchanged coal is fast in combustion reaction, most of the S content was desulfurized by coal ash. The ash content yielded from Ca-ion exchanged coal was more excellent in SO2 capture ability than limestone even under higher pressure. In the case of CO2 partial pressure lower than equilibrium CO2 pressure for CaCO3 decomposition, the capture ability decreased with an increase in total pressure, while in higher CO2 partial pressure, it was improved. 1 ref., 7 figs., 2 tabs.

Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions

Science.gov (United States)

Petrov, Yu. V.; Anikeva, A. E.; Vyvenko, O. F.

2018-06-01

Secondary electron emission from thin silicon nitride films of different thicknesses on silicon excited by helium ions with energies from 15 to 35 keV was investigated in the helium ion microscope. Secondary electron yield measured with Everhart-Thornley detector decreased with the irradiation time because of the charging of insulating films tending to zero or reaching a non-zero value for relatively thick or thin films, respectively. The finiteness of secondary electron yield value, which was found to be proportional to electronic energy losses of the helium ion in silicon substrate, can be explained by the electron emission excited from the substrate by the helium ions. The method of measurement of secondary electron energy distribution from insulators was suggested, and secondary electron energy distribution from silicon nitride was obtained.

Biomaterial imaging with MeV-energy heavy ion beams

Energy Technology Data Exchange (ETDEWEB)

Seki, Toshio, E-mail: seki@sakura.nucleng.kyoto-u.ac.jp [Department of Nuclear Engineering, Kyoto Univ., Uji, Kyoto 611-0011 (Japan); CREST, Japan Science and Technology Agency (JST), Chiyoda, Tokyo 102-0075 (Japan); Wakamatsu, Yoshinobu; Nakagawa, Shunichiro [Department of Nuclear Engineering, Kyoto Univ., Uji, Kyoto 611-0011 (Japan); Aoki, Takaaki [Department of Electronic Science and Engineering, Kyoto Univ., Nishikyo, Kyoto 615-8510 (Japan); CREST, Japan Science and Technology Agency (JST), Chiyoda, Tokyo 102-0075 (Japan); Ishihara, Akihiko [Laboratory of Cell Biology and Life Science, Graduate School of Human and Environmental Studies, Kyoto Univ., Sakyo, Kyoto 606-8501 (Japan); Matsuo, Jiro [Quantum Science and Engineering Center, Kyoto Univ., Uji, Kyoto 611-0011 (Japan); CREST, Japan Science and Technology Agency (JST), Chiyoda, Tokyo 102-0075 (Japan)

2014-08-01

The spatial distribution of several chemical compounds in biological tissues and cells can be obtained with mass spectrometry imaging (MSI). In conventional secondary ion mass spectrometry (SIMS) with keV-energy ion beams, elastic collisions occur between projectiles and atoms of constituent molecules. The collisions produce fragments, making the acquisition of molecular information difficult. In contrast, ion beams with MeV-energy excite near-surface electrons and enhance the ionization of high-mass molecules; hence, SIMS spectra of fragment-suppressed ionized molecules can be obtained with MeV-SIMS. To compare between MeV and conventional SIMS, we used the two methods based on MeV and Bi{sub 3}-keV ions, respectively, to obtain molecular images of rat cerebellum. Conventional SIMS images of m/z 184 were clearly observed, but with the Bi{sub 3} ion, the distribution of the molecule with m/z 772.5 could be observed with much difficulty. This effect was attributed to the low secondary ion yields and we could not get many signal counts with keV-energy beam. On the other hand, intact molecular ion distributions of lipids were clearly observed with MeV-SIMS, although the mass of all lipid molecules was higher than 500 Da. The peaks of intact molecular ions in MeV-SIMS spectra allowed us to assign the mass. The high secondary ion sensitivity with MeV-energy heavy ions is very useful in biomaterial analysis.

Biomaterial imaging with MeV-energy heavy ion beams

International Nuclear Information System (INIS)

Seki, Toshio; Wakamatsu, Yoshinobu; Nakagawa, Shunichiro; Aoki, Takaaki; Ishihara, Akihiko; Matsuo, Jiro

2014-01-01

The spatial distribution of several chemical compounds in biological tissues and cells can be obtained with mass spectrometry imaging (MSI). In conventional secondary ion mass spectrometry (SIMS) with keV-energy ion beams, elastic collisions occur between projectiles and atoms of constituent molecules. The collisions produce fragments, making the acquisition of molecular information difficult. In contrast, ion beams with MeV-energy excite near-surface electrons and enhance the ionization of high-mass molecules; hence, SIMS spectra of fragment-suppressed ionized molecules can be obtained with MeV-SIMS. To compare between MeV and conventional SIMS, we used the two methods based on MeV and Bi 3 -keV ions, respectively, to obtain molecular images of rat cerebellum. Conventional SIMS images of m/z 184 were clearly observed, but with the Bi 3 ion, the distribution of the molecule with m/z 772.5 could be observed with much difficulty. This effect was attributed to the low secondary ion yields and we could not get many signal counts with keV-energy beam. On the other hand, intact molecular ion distributions of lipids were clearly observed with MeV-SIMS, although the mass of all lipid molecules was higher than 500 Da. The peaks of intact molecular ions in MeV-SIMS spectra allowed us to assign the mass. The high secondary ion sensitivity with MeV-energy heavy ions is very useful in biomaterial analysis

Electron cloud effects in intense, ion beam linacs theory and experimental planning for heavy-ion fusion

International Nuclear Information System (INIS)

Molvik, A.W.; Cohen, R.H.; Lund, S.M.; Bieniosek, F.M.; Lee, E.P.; Prost, L.R.; Seidl, P.A.; Vay, Jean-Luc

2002-01-01

Heavy-ion accelerators for HIF will operate at high aperture-fill factors with high beam current and long pulses. This will lead to beam ions impacting walls: liberating gas molecules and secondary electrons. Without special preparation a large fractional electron population ((ge)1%) is predicted in the High-Current Experiment (HCX), but wall conditioning and other mitigation techniques should result in substantial reduction. Theory and particle-in-cell simulations suggest that electrons, from ionization of residual and desorbed gas and secondary electrons from vacuum walls, will be radially trapped in the ∼4 kV ion beam potential. Trapped electrons can modify the beam space charge, vacuum pressure, ion transport dynamics, and halo generation, and can potentially cause ion-electron instabilities. Within quadrupole (and dipole) magnets, the longitudinal electron flow is limited to drift velocities (E x B and (del)B) and the electron density can vary azimuthally, radially, and longitudinally. These variations can cause centroid misalignment, emittance growth and halo growth. Diagnostics are being developed to measure the energy and flux of electrons and gas evolved from walls, and the net charge and gas density within magnetic quadrupoles, as well as the their effect on the ion beam

Revised data taking schedule with ion beams

CERN Document Server

Gazdzicki, Marek; Aduszkiewicz, A; Andrieu, B; Anticic, T; Antoniou, N; Argyriades, J; Asryan, A G; Baatar, B; Blondel, A; Blumer, J; Boldizsar, L; Bravar, A; Brzychczyk, J; Bubak, A; Bunyatov, S A; Choi, K U; Christakoglou, P; Chung, P; Cleymans, J; Derkach, D A; Diakonos, F; Dominik, W; Dumarchez, J; Engel, R; Ereditato, A; Feofilov, G A; Fodor, Z; Ferrero, A; Gazdzicki, M; Golubeva, M; Grebieszkow, K; Grzeszczuk, A; Guber, F; Hasegawa, T; Haungs, A; Igolkin, S; Ivanov, A S; Ivashkin, A; Kadija, K; Katrynska, N; Kielczewska, D; Kikola, D; Kisiel, J; Kobayashi, T; Kolesnikov, V I; Kolev, D; Kolevatov, R S; Kondratiev, V P; Kowalski, S; Kurepin, A; Lacey, R; Laszlo, A; Lyubushkin, V V; Majka, Z; I Malakhov, A; Marchionni, A; Marcinek, A; Maris, I; Matveev, V; Melkumov, G L; Meregaglia, A; Messina, M; Mijakowski, P; Mitrovski, M; Montaruli, T; Mrówczynski, St; Murphy, S; Nakadaira, T; Naumenko, P A; Nikolic, V; Nishikawa, K; Palczewski, T; Pálla, G; Panagiotou, A D; Peryt, W; Planeta, R; Pluta, J; Popov, B A; Posiadala, M; Przewlocki, P; Rauch, W; Ravonel, M; Renfordt, R; Röhrich, D; Rondio, E; Rossi, B; Roth, M; Rubbia, A; Rybczynski, M; Sadovskii, A; Sakashita, K; Schuster, T; Sekiguchi, T; Seyboth, P; Shibata, M; Sissakian, A N; Skrzypczak, E; Slodkowski, M; Sorin, A S; Staszel, P; Stefanek, G; Stepaniak, J; Strabel, C; Ströbele, H; Susa, T; Szentpétery, I; Szuba, M; Tada, M; Taranenko, A; Tsenov, R; Ulrich, R; Unger, M; Vassiliou, M; Vechernin, V V; Vesztergombi, G; Wlodarczyk, Z; Wojtaszek, A; Zipper, W; CERN. Geneva. SPS and PS Experiments Committee; SPSC

2009-01-01

This document presents the revised data taking schedule of NA61 with ion beams. The revision takes into account limitations due to the new LHC schedule as well as final results concerning the physics performance with secondary ion beams. It is proposed to take data with primary Ar and Xe beams in 2012 and 2014, respectively, and to test and use for physics a secondary B beam from primary Pb beam fragmentation in 2010, 2011 and 2013.

In Situ Monitoring of Temperature inside Lithium-Ion Batteries by Flexible Micro Temperature Sensors

Directory of Open Access Journals (Sweden)

Pei-Chi Chen

2011-10-01

Full Text Available Lithium-ion secondary batteries are commonly used in electric vehicles, smart phones, personal digital assistants (PDA, notebooks and electric cars. These lithium-ion secondary batteries must charge and discharge rapidly, causing the interior temperature to rise quickly, raising a safety issue. Over-charging results in an unstable voltage and current, causing potential safety problems, such as thermal runaways and explosions. Thus, a micro flexible temperature sensor for the in in-situ monitoring of temperature inside a lithium-ion secondary battery must be developed. In this work, flexible micro temperature sensors were integrated into a lithium-ion secondary battery using the micro-electro-mechanical systems (MEMS process for monitoring temperature in situ.

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Highly charged ion based time-of-flight emission microscope

International Nuclear Information System (INIS)

Hamza, Alex V.; Barnes, Alan V.; Magee, Ed; Newman, Mike; Schenkel, Thomas; McDonald, Joseph W.; Schneider, Dieter H.

2000-01-01

An emission microscope using highly charged ions as the excitation source has been designed, constructed, and operated. A novel ''acorn'' objective lens has been used to simultaneously image electron and secondary ion emission. A resistive anode-position sensitive detector is used to determine the x-y position and time of arrival of the secondary events at the microscope image plane. Contrast in the image can be based on the intensity of the electron emission and/or the presence of particular secondary ions. Spatial resolution of better than 1 μm and mass resolution m/Δm of better than 400 were demonstrated. Background rejection from uncorrelated events of greater than an order of magnitude is also achieved. (c) 2000 American Institute of Physics

Dose distribution around ion track in tissue equivalent material

International Nuclear Information System (INIS)

Zhang Wenzhong; Guo Yong; Luo Yisheng

2007-01-01

Objective: To study the energy deposition micro-specialty of ions in body-tissue or tissue equivalent material (TEM). Methods: The water vapor was determined as the tissue equivalent material, based on the analysis to the body-tissue, and Monte Carlo method was used to simulate the behavior of proton in the tissue equivalent material. Some features of the energy deposition micro-specialty of ion in tissue equivalent material were obtained through the analysis to the data from calculation. Results: The ion will give the energy by the way of excitation and ionization in material, then the secondary electrons will be generated in the progress of ionization, these electron will finished ions energy deposition progress. When ions deposited their energy, large amount energy will be in the core of tracks, and secondary electrons will devote its' energy around ion track, the ion dose distribution is then formed in TEM. Conclusions: To know biological effects of radiation , the research to dose distribution of ions is of importance(significance). (authors)

Ion-induced particle desorption in time-of-flight medium energy ion scattering

Science.gov (United States)

Lohmann, S.; Primetzhofer, D.

2018-05-01

Secondary ions emitted from solids upon ion impact are studied in a time-of-flight medium energy ion scattering (ToF-MEIS) set-up. In order to investigate characteristics of the emission processes and to evaluate the potential for surface and thin film analysis, experiments employing TiN and Al samples were conducted. The ejected ions exhibit a low initial kinetic energy of a few eV, thus, requiring a sufficiently high acceleration voltage for detection. Molecular and atomic ions of different charge states originating both from surface contaminations and the sample material are found, and relative yields of several species were determined. Experimental evidence that points towards a predominantly electronic sputtering process is presented. For emitted Ti target atoms an additional nuclear sputtering component is suggested.

Critical Review of Commercial Secondary Lithium-Ion Battery Safety Standards

Science.gov (United States)

Jones, Harry P.; Chapin, Thomas, J.; Tabaddor, Mahmod

2010-09-01

The development of Li-ion cells with greater energy density has lead to safety concerns that must be carefully assessed as Li-ion cells power a wide range of products from consumer electronics to electric vehicles to space applications. Documented field failures and product recalls for Li-ion cells, mostly for consumer electronic products, highlight the risk of fire, smoke, and even explosion. These failures have been attributed to the occurrence of internal short circuits and the subsequent thermal runaway that can lead to fire and explosion. As packaging for some applications include a large number of cells, the risk of failure is likely to be magnified. To address concerns about the safety of battery powered products, safety standards have been developed. This paper provides a review of various international safety standards specific to lithium-ion cells. This paper shows that though the standards are harmonized on a host of abuse conditions, most lack a test simulating internal short circuits. This paper describes some efforts to introduce internal short circuit tests into safety standards.

Spin-dependent electron emission from metals in the neutralization of He+ ions

International Nuclear Information System (INIS)

Alducin, M.; Roesler, M.; Juaristi, J.I.; Muino, R. Diez; Echenique, P.M.

2005-01-01

We calculate the spin-polarization of electrons emitted in the neutralization of He + ions interacting with metals. All stages of the emission process are included: the spin-dependent perturbation induced by the projectile, the excitation of electrons in Auger neutralization processes, the creation of a cascade of secondaries, and the escape of the electrons through the surface potential barrier. The model allows us to explain in quantitative terms the measured spin-polarization of the yield in the interaction of spin-polarized He + ions with paramagnetic surfaces, and to disentangle the role played by each of the involved mechanisms. We show that electron-electron scattering processes at the surface determine the spin-polarization of the total yield. High energy emitted electrons are the ones providing direct information on the He + ion neutralization process and on the electronic properties of the surface

Ion-molecule reactions in alkynes

International Nuclear Information System (INIS)

Lifshitz, C.; Weiss, M.

1980-01-01

Fragment ions from 1,5-hexadiyne are trapped in an electron space charge and allowed to react with the neutral 1,5-hexadiyne present. The reactivities are similar to those of ions of the same elementary formulae in the benzene system. Secondary ions of major abundance observed are, in decreasing order of importance: C 10 H + 8 , C 9 H + 7 , C 12 H + 8 , C 12 H + 9 and C 7 H + 7 . In contrast to the benzene system, the ion C 12 H + 11 is of minor importance. (orig.)

Acetabular bone density and metal ions after metal-on-metal versus metal-on-polyethylene total hip arthroplasty; short-term results

NARCIS (Netherlands)

Zijlstra, Wierd P.; van der Veen, Hugo C.; van den Akker-Scheek, Inge; Zee, Mark J. M.; Bulstra, Sjoerd K.; van Raay, Jos J. A. M.

Information on periprosthetic acetabular bone density is lacking for metal-on-metal total hip arthroplasties. These bearings use cobalt-chromium instead of titanium acetabular components, which could lead to stress shielding and hence periprosthetic bone loss. Cobalt and chromium ions have

Desorption of organic molecules with fast incident atomic and polyatomic ions

International Nuclear Information System (INIS)

Hunt, J.E.; Salehpour, M.; Fishel, D.L.

1989-01-01

In 1974, Macfarlane and coworkers introduced a new mass spectrometric technique based on desorption-ionization of sample molecules from solid targets by the impact of fast heavy ions (fission fragments) from 252 Cf. The process of ion-induced desorption of molecular ions from surfaces is not yet fully understood, although a large amount of experimental data related to the mechanism has been published. This paper concerns the use of fast incident polyatomic ions to induce desorption of secondary molecular ions of valine and chlorophyll from surfaces. Polyatomic ions are unique in that they are a collection of temporally and spatially correlated atoms. The main finding in this study is that incident polyatomic ions produce drastic enhancements in the secondary ion yields over atomic ions. Also, two types of nonlinear effects in desorption have been observed and will be discussed

Negative ion formation processes: A general review

International Nuclear Information System (INIS)

Alton, G.D.

1990-01-01

The principal negative ion formation processes will be briefly reviewed. Primary emphasis will be placed on the more efficient and universal processes of charge transfer and secondary ion formation through non-thermodynamic surface ionization. 86 refs., 20 figs

Quantitative imaging of magnesium distribution at single-cell resolution in brain tumors and infiltrating tumor cells with secondary ion mass spectrometry (SIMS)

Science.gov (United States)

Chandra, Subhash; Parker, Dylan J.; Barth, Rolf F.; Pannullo, Susan C.

2016-01-01

Glioblastoma multiforme (GBM) is one of the deadliest forms of human brain tumors. The infiltrative pattern of growth of these tumors includes the spread of individual and/or clusters of tumor cells at some distance from the main tumor mass in parts of the brain protected by an intact blood-brain-barrier. Pathophysiological studies of GBM could be greatly enhanced by analytical techniques capable of in situ single-cell resolution measurements of infiltrating tumor cells. Magnesium homeostasis is an area of active investigation in high grade gliomas. In the present study, we have used the F98 rat glioma as a model of human GBM and an elemental/isotopic imaging technique of secondary ion mass spectrometry (SIMS), a CAMECA IMS-3f ion microscope, for studying Mg distributions with single-cell resolution in freeze-dried brain tissue cryosections. Quantitative observations were made on tumor cells in the main tumor mass, contiguous brain tissue, and infiltrating tumor cells in adjacent normal brain. The brain tissue contained a significantly lower total Mg concentration of 4.70 ± 0.93 mmol/Kg wet weight (mean ± SD) in comparison to 11.64 ± 1.96 mmol/Kg wet weight in tumor cells of the main tumor mass and 10.72 ± 1.76 mmol/Kg wet weight in infiltrating tumor cells (p<0.05). The nucleus of individual tumor cells contained elevated levels of bound Mg. These observations demonstrate enhanced Mg-influx and increased binding of Mg in tumor cells and provide strong support for further investigation of GBMs for altered Mg homeostasis and activation of Mg-transporting channels as possible therapeutic targets. PMID:26703785

Study of plasma confinement in ELMO Bumpy Torus with a heavy-ion beam probe

Energy Technology Data Exchange (ETDEWEB)

Bieniosek, F. M.

1981-01-01

Plasma confinement in ELMO Bumpy Torus (EBT) is generally strongly dependent on an ambipolar electric field. Spatially resolved measurements of the resulting electric space potential phi/sub sp/ have been made in a single plasma cross section by the heavy-ion beam probe. This diagnostic injects a 4-60-keV beam of (usually) Cs/sup +/ ions into the plasma. Measurement of the energy of Cs/sup 2 +/ secondary ions leaving the plasma gives a continuous monitor of the local space potential. In addition, the total detected Cs/sup 2 +/ ion current is proportional to the product of the local electron density and the ionization rate, which, in turn, is a function of the electron temperature. This signal, nf(T/sub e/), is sensitive to all three electron distributions found in EBT - those of the cold surface plasma, the warm core plasma, and the hot electron ring.

Study of plasma confinement in ELMO Bumpy Torus with a heavy-ion beam probe

International Nuclear Information System (INIS)

Bieniosek, F.M.

1981-01-01

Plasma confinement in ELMO Bumpy Torus (EBT) is generally strongly dependent on an ambipolar electric field. Spatially resolved measurements of the resulting electric space potential phi/sub sp/ have been made in a single plasma cross section by the heavy-ion beam probe. This diagnostic injects a 4-60-keV beam of (usually) Cs + ions into the plasma. Measurement of the energy of Cs 2+ secondary ions leaving the plasma gives a continuous monitor of the local space potential. In addition, the total detected Cs 2+ ion current is proportional to the product of the local electron density and the ionization rate, which, in turn, is a function of the electron temperature. This signal, nf(T/sub e/), is sensitive to all three electron distributions found in EBT - those of the cold surface plasma, the warm core plasma, and the hot electron ring

Thorium molecular negative ion production in a cesium sputter source at BARC-TIFR pelletron accelerator ion source test set up

International Nuclear Information System (INIS)

Gupta, A.K.; Mehrotra, N.; Kale, R.M.; Alamelu, D.; Aggarwal, S.K.

2005-01-01

Ion source test set up at Pelletron Accelerator facility has been utilized extensively for the production and characterization of negative ions, with particular emphasis being place at the species of experimental users interest. The attention have been focussed towards the formation of rare earth negative ions, due to their importance in the ongoing accelerator mass spectroscopy program and isotopic abundance measurements using secondary negative ion mass spectrometry

Total yield and escape depth of electrons from heavy ion solid interactions

International Nuclear Information System (INIS)

Frischkorn, H.J.; Burkhard, M.; Groenveld, K.O.; Hofmann, D.; Koschar, P.; Latz, R.; Schader, J.

1983-01-01

At high projectile energies ( aboutMeV/U) several mechanisms for electron production are discussed as e.g. direct ionization collisions, recoil particle cascades, collective electron emission. Results are presented of total electron yield (#betta#) measurements over a wide projectile energy E /SUB p/ range (40 keV/U< E /SUB p/ /M <12 MeV/U) and a wide projectile Z /SUB p/ range (1<2 /SUB p-/ <92) of both monoionic and molecular projectiles and of different target thicknesses. From the target thickness dependence of #betta# the mean free path lambda of electrons in carbon can be calculated. The data are discussed in the frame of current theories. Significant deviations from calculated values and predicted dependencies are found, in particular for projectile velocities v /SUB p/ close to the Fermi velocity v /SUB F/ of target electrons and for molecular projectile ions

Secondary ions mass spectroscopy measurements of dopant impurities in highly stressed InGaN laser diodes

International Nuclear Information System (INIS)

Marona, L.; Suski, T.; Perlin, P.; Czernecki, R.; Leszczynski, M.; Bockowski, M.; Jakiela, R.; Najda, S. P.

2011-01-01

We performed a systematic secondary ions mass spectroscopy (SIMS) study of dopant impurities in life-time stressed InGaN laser devices in order to investigate the main degradation mechanism that is observed in nitride laser diodes. A continuous wave (cw) current density of 3 kA/cm 2 was applied to InGaN laser diodes over an extended period of time and we observed the characteristic square root degradation of optical power. We compared the SIMS profiles of Mg, H, and Si impurities in the aged devices and observe that the impurities are remarkably stable over 10 000 h of cw operation. Nor is there any SIMS evidence of p-contact metals penetrating into the semiconductor material. Thus our SIMS results are contrary to what one would expect for impurity diffusion causing the observed square root degradation characteristic.

Beam losses in heavy ion drivers

CERN Document Server

Mustafin, E R; Hofmann, I; Spiller, P J

2002-01-01

While beam loss issues have hardly been considered in detail for heavy ion fusion scenarios, recent heavy ion machine developments in different labs (European Organization for Nuclear Research (CERN), Gesellschaft fur Schwerionenforschung (GSI), Institute for Theoretical and Experimental Physics (ITEP), Relativistic Heavy-Ion Collider (RHIC)) have shown the great importance of beam current limitations due to ion losses. Two aspects of beam losses in heavy ion accelerators are theoretically considered: (1) secondary neutron production due to lost ions, and (2) vacuum pressure instability due to charge exchange losses. Calculations are compared and found to be in good agreement with measured data. The application to a Heavy-Ion Driven Inertial Fusion (HIDIF) scenario is discussed. 12 Refs.

Reconstruction of a total avulsion of the hepatic veins and the suprahepatic inferior vena cava secondary to blunt thoracoabdominal trauma.

Science.gov (United States)

Kaemmerer, Daniel; Daffner, Wolfgang; Niwa, Martin; Kuntze, Thomas; Hommann, Merten

2011-02-01

Blunt injury to the inferior vena cava is a rare but dramatic event having a high mortality up to 80%. The mortality increases after total avulsion especially in combination with secondary intra-abdominal injuries. We report on a 15-year-old boy who sustained a blunt trauma with a total, partially covered avulsion of the hepatic veins and the suprahepatic inferior vena cava. We treated the patient under internal bypassing of the retrohepatic vena cava by using the heart-lung machine and reconstructed the hepatic veins and suprahepatic vena cava with a conduit made of pericard.

Electrospray ion source with reduced analyte electrochemistry

Science.gov (United States)

Kertesz, Vilmos [Knoxville, TN; Van Berkel, Gary [Clinton, TN

2011-08-23

An electrospray ion (ESI) source and method capable of ionizing an analyte molecule without oxidizing or reducing the analyte of interest. The ESI source can include an emitter having a liquid conduit, a working electrode having a liquid contacting surface, a spray tip, a secondary working electrode, and a charge storage coating covering partially or fully the liquid contacting surface of the working electrode. The liquid conduit, the working electrode and the secondary working electrode can be in liquid communication. The electrospray ion source can also include a counter electrode proximate to, but separated from, said spray tip. The electrospray ion source can also include a power system for applying a voltage difference between the working electrodes and a counter-electrode. The power system can deliver pulsed voltage changes to the working electrodes during operation of said electrospray ion source to minimize the surface potential of the charge storage coating.

Ion source techniques for high-speed processing of material surface by ion beams

International Nuclear Information System (INIS)

Ishikawa, Junzo

1990-01-01

The present paper discusses some key or candidate techniques for future ion source development and such ion sources developed by the author. Several types of microwave ion sources for producing low charge state ions have been developed in Japan. When a microwave plasma cathode developed by the author is adapted to a Kaufman type ion source, the electron emission currents are found to be 2.5 A for argon gas and 0.5-0.9 A for oxygen gas. An alternative ionization method for metal atoms is strongly required for high-speed processing of material surface by metal-ion beams. Detailed discussion is made of collisional ionization of vaporized atoms, and negative-ion production (secondary negative-ion emission by sputtering). An impregnated electrode type liquid-metal ion source developed by the author, which has a porous tip structure, is described. The negative-ion production efficiency is quite high. The report also presents a neutral and ionized alkaline-metal bombardment type heavy negative-ion source, which consists of a cesium plasma ion source, suppressor, target electrode, negative-ion extraction electrode, and einzel lens. (N.K.)

Dependence of J/ψ suppression in heavy ion collisions on total transverse energy, nucleon numbers and J/ψ transverse momentum

International Nuclear Information System (INIS)

Ftacnik, J.; Lichard, P.

1989-01-01

We present a set of semiquantitative predictions for the behaviour of J/ψ suppression in heavy ion collisions as a function of the total transverse energy, nucleon numbers of colliding ions and the J/ψ transverse momentum. These predictions are based on the assumption that all of J/ψ suppression is due to J/ψ and χ disintegrations in collisions with hadrons in a dense hadronic gas formed in the heavy ion collisions. The hydrodynamic evolution of the hadron gas is taken into account. The onset of the quark-gluon plasma formation should manifest itself by clear qualitative deviations from J/ψ suppression calculated in this way, in particular as thresholds or kinks in the E T -dependence, or as a threshold for J/ψ suppression as a function of the atomic number of the target, expected at Cu or below. (orig.)

Single ion hit detection set-up for the Zagreb ion microprobe

Science.gov (United States)

Smith, R. W.; Karlušić, M.; Jakšić, M.

2012-04-01

Irradiation of materials by heavy ions accelerated in MV tandem accelerators may lead to the production of latent ion tracks in many insulators and semiconductors. If irradiation is performed in a high resolution microprobe facility, ion tracks can be ordered by submicrometer positioning precision. However, full control of the ion track positioning can only be achieved by a reliable ion hit detection system that should provide a trigger signal irrespectively of the type and thickness of the material being irradiated. The most useful process that can be utilised for this purpose is emission of secondary electrons from the sample surface that follows the ion impact. The status report of the set-up presented here is based on the use of a channel electron multiplier (CEM) detector mounted on an interchangable sample holder that is inserted into the chamber in a close geometry along with the sample to be irradiated. The set-up has been tested at the Zagreb ion microprobe for different ions and energies, as well as different geometrical arrangements. For energies of heavy ions below 1 MeV/amu, results show that efficient (100%) control of ion impact can be achieved only for ions heavier than silicon. The successful use of the set-up is demonstrated by production of ordered single ion tracks in a polycarbonate film and by monitoring fluence during ion microbeam patterning of Foturan glass.

Negative ion sources

International Nuclear Information System (INIS)

Ishikawa, Junzo; Takagi, Toshinori

1983-01-01

Negative ion sources have been originally developed at the request of tandem electrostatic accelerators, and hundreds of nA to several μA negative ion current has been obtained so far for various elements. Recently, the development of large current hydrogen negative ion sources has been demanded from the standpoint of the heating by neutral particle beam injection in nuclear fusion reactors. On the other hand, the physical properties of negative ions are interesting in the thin film formation using ions. Anyway, it is the present status that the mechanism of negative ion action has not been so fully investigated as positive ions because the history of negative ion sources is short. In this report, the many mechanisms about the generation of negative ions proposed so far are described about negative ion generating mechanism, negative ion source plasma, and negative ion generation on metal surfaces. As a result, negative ion sources are roughly divided into two schemes, plasma extraction and secondary ion extraction, and the former is further classified into the PIG ion source and its variation and Duoplasmatron and its variation; while the latter into reflecting and sputtering types. In the second half of the report, the practical negative ion sources of each scheme are described. If the mechanism of negative ion generation will be investigated more in detail and the development will be continued under the unified know-how as negative ion sources in future, the development of negative ion sources with which large current can be obtained for any element is expected. (Wakatsuki, Y.)

Detection of gold cluster ions by ion-to-ion conversion using a CsI-converter

International Nuclear Information System (INIS)

Nguyen, V.-T.; Novilkov, A.C.; Obnorskii, V.V.

1997-01-01

Gold cluster ions in the m/z range of 10 4 -2 x 10 6 u were produced by bombarding a thin film of gold with 252 Cf-fission fragments. The gold covering a C-Al substrate formed islets having a mean diameter of 44 A. Their size- and mass-distribution was determined by means of electron microscopy. The main task was to measure the m/z distribution of the cluster ions ejected from the sample surface. For this purpose we built a time-of-flight (TOF) mass spectrometer, which could be used as a linear TOF instrument or, alternatively, as a tandem-TOF instrument being equipped with an ion-to-ion converter. Combining the results obtained in both modes, it turned out that the linear TOF instrument equipped with micro-channel plates had a mean detection efficiency for 20 keV cluster ions of about 40%. In the tandem mode, the cluster ions hit a CsI converter with energies of 40z keV (z = charge state), from where secondary ions - mainly Cs + and (CsI) n Cs + cluster ions - were ejected. These ions were used to measure the TOF spectrum of the gold cluster ions. The detection efficiency of the cluster ions was found to vary in the available mass range from 99.7% to 96.5%. The complete mass distribution between 4 x 10 4 and 4 x 10 6 u was determined and compared with the corresponding mass distribution of the gold islets covering the substrate. (orig.)

A new approach to nuclear microscopy: The ion-electron emission microscope

International Nuclear Information System (INIS)

Doyle, B.L.; Vizkelethy, G.; Walsh, D.S.; Senftinger, B.; Mellon, M.

1998-01-01

A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion

Simulation study of radial dose due to the irradiation of a swift heavy ion aiming to advance the treatment planning system for heavy particle cancer therapy: The effect of emission angles of secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Moribayashi, Kengo, E-mail: moribayashi.kengo@jaea.go.jp

2015-12-15

A radial dose simulation model has been proposed in order to advance the treatment planning system for heavy particle cancer therapy. Here, the radial dose is the dose due to the irradiation of a heavy ion as a function of distances from this ion path. The model proposed here may overcome weak points of paradigms that are employed to produce the conventional radial dose distributions. To provide the radial dose with higher accuracy, this paper has discussed the relationship between the emission angles of secondary electrons and the radial dose. It is found that the effect of emission angles becomes stronger on the radial dose with increasing energies of the secondary electrons.

Potential for chlorate interference in ion chromatographic determination of total nitrogen in natural waters following alkaline persulfate digestion.

Science.gov (United States)

Halstead, J A; Edwards, J; Soracco, R J; Armstrong, R W

1999-10-01

Determination of total nitrogen in aqueous samples after thermal potassium peroxydisulfate (persulfate) digestion is a commonly used alternative to the tedious Kjeldahl procedure. When ion chromatography is used to quantify the nitrate formed during digestion, there is a potential for interference from a chlorate peak if the digested sample initially contained chloride in concentrations close to or greater than the concentration of nitrogen. It was determined that this interference can be avoided either by using chromatographic conditions which cleanly resolve the nitrate and chlorate peaks (e.g., the Dionex AG9-HG column) or by using digestion reagent concentrations chosen to maintain a high pH throughout the digestion. The second alternative is not a viable option for investigators using a single digestion for both total nitrogen (TN) and total phosphorus (TP) analysis.

Measurement of the redistribution of arsenic at nickel silicide/silicon interface by secondary ion mass spectrometry: artifact and optimized analysis conditions

International Nuclear Information System (INIS)

Hoummada, K.; Mangelinck, D.; Perrin, C.; Carron, V.; Holliger, P.

2008-01-01

The arsenic redistribution after NiSi formation has been measured by secondary ion mass spectrometry (SIMS). The NiSi film has been obtained by solid state reaction of a Ni thin film with a silicon substrate doped with As. An increase in the As SIMS signal at the NiSi/Si interface was observed for some experimental conditions. By varying the SIMS experimental parameters (incidence angle and the impact energy), the As signal at NiSi/Si interface was found to change. The SIMS experimental parameters have been optimized and were found to be an impact energy of 1 keV and an incidence angle superior to 50 deg. This allows us to minimize differences in sputtering rate and ion yield between NiSi and Si and to obtain a good depth resolution and dynamic range. Under these conditions the bump in the As signal does not appear: this illustrates the difficulty to measure concentration at interface by SIMS

Study on charge transfer reaction of several organic molecules with accelerated rare gas ions

International Nuclear Information System (INIS)

Takahasi, Makoto; Okuda, Sachiko; Arai, Eiichi; Ichinose, Akira; Takakubo, Masaaki.

1984-01-01

Observing the charge transfer mass spectra of ethylbenzene, cyclobutane and methanol in Ar and Xe ion impacts, we investigated the dependence of the secondary ion peak intensities (normalized to primary ion current and target pressure) on the translational energy of primary ions (0-3500 eV).In the case of ethylbenzene, several maxima of the secondary i on peak intensities were observed in Ar and Xe ion impacts. The correlation between the maxima and the primary ion energy was examined in terms of near adiabatic theory of Massey. Supplementary studies on the energy distribution of primary ion, charge transfer cross section between methanol and Xe ion, and final product analysis in rare gas ion irradiation on cyclobutane were described. (author)

Transport of negative hydrogen and deuterium ions in RF-driven ion sources

International Nuclear Information System (INIS)

Gutser, R; Wuenderlich, D; Fantz, U

2010-01-01

Negative hydrogen ion sources are major components of neutral beam injection systems for plasma heating in future large-scale fusion experiments such as ITER. In order to fulfill the requirements of the ITER neutral beam injection, a high-performance, large-area RF-driven ion source for negative ions is being developed at the MPI fuer Plasmaphysik. Negative hydrogen ions are mainly generated on a converter surface by impinging neutral particles and positive ions under the influence of magnetic fields and the plasma sheath potential. The 3D transport code TrajAn has been applied in order to obtain the total and spatially resolved extraction probabilities for H - and D - ions under identical plasma parameters and the realistic magnetic field topology of the ion source. A comparison of the isotopes shows a lower total extraction probability in the case of deuterium ions, caused by a different transport effect. The transport calculation shows that distortions of the spatial distributions of ion birth and extraction by the magnetic electron suppression field are present for both negative hydrogen and deuterium ions.

Characterization of the surface organization of nanostructured hybrid organic-inorganic materials by time-of-flight secondary ion mass spectrometry

Science.gov (United States)

Cerveau; Corriu; Dabosi; Fischmeister-Lepeytre; Combarieu

1999-01-01

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to analyse the surface composition of organic-inorganic hybrid solids obtained by a sol-gel process. Gels of type O(1.5)Si-R-SiO(1. 5), obtained from bis-silylated precursors (R'O)(3)-R-Si(OR')(3) (R' = Me, Et and R = (-CH(2))(n)-, n = 1, 2, 6, 10, 12;--CH=CH-; (-CH(2))(3)NH(CH(2))(3)-; 1, 1'-ferrocenyl; (CH(2))(n)-Ph-(CH(2))(n)- with Ph = 1,4-phenylene and n = 0, 1, 2; Ph = 1,3,5-phenyl and n = 0) were analysed. The results were highly dependent on the nature of the organic group. When the organic group was small or 'rigid', the main peaks detected corresponded to SiOH and SiOR' residual groups. Fragment ions from the organic group were poorly detected in this case. When the organic group was larger and more 'flexible', characteristic mass fragment ions were detected at higher relative intensities, indicative of a different organization of the organic units in the solid. TOF-SIMS clearly showed the differences between the xerogels derived from mono- and bis-silylated organic precursors : the organic group is present at the surface of mono-silylated xerogels, whereas for bis-silylated ones, the organization is dependent on the length and the flexibility of the organic units. These TOF-SIMS results are in agreement with other features already reported. Copyright 1999 John Wiley & Sons, Ltd.

Applications of ion beam analysis workshop. Workshop handbook

International Nuclear Information System (INIS)

1995-01-01

A workshop on applications of ion beam analysis was held at ANSTO, immediate prior to the IBMM-95 Conference in Canberra. It aims was to review developments and current status on use of ion beams for analysis, emphasizing the following aspects: fundamental ion beam research and secondary effects of ion beams; material sciences, geological, life sciences, environmental and industrial applications; computing codes for use in accelerator research; high energy heavy ion scattering and recoil; recent technological development using ion beams. The handbook contains the workshop's program, 29 abstracts and a list of participants

Laser cutting of graphite anodes for automotive lithium-ion secondary batteries: investigations in the edge geometry and heat-affected zone

Science.gov (United States)

Schmieder, Benjamin

2012-03-01

To serve the high need of lithium-ion secondary batteries of the automobile industry in the next ten years it is necessary to establish highly reliable, fast and non abrasive machining processes. In previous works [1] it was shown that high cutting speeds with several meters per second are achievable. For this, mainly high power single mode fibre lasers with up to several kilo watts were used. Since lithium-ion batteries are very fragile electro chemical systems, the cutting speed is not the only thing important. To guarantee a high cycling stability and a long calendrical life time the edge quality and the heat affected zone (HAZ) are equally important. Therefore, this paper tries to establish an analytical model for the geometry of the cutting edge based on the ablation thresholds of the different materials. It also deals with the composition of the HAZ in dependence of the pulse length, generated by laser remote cutting with pulsed fibre laser. The characterisation of the HAZ was done by optical microscopy, SEM, EDX and Raman microscopy.

Secondary-electron yield from Au induced by highly charged Ta ions

Czech Academy of Sciences Publication Activity Database

Krása, Josef; Láska, Leoš; Stöckli, M. P.; Fry, D.

2001-01-01

Roč. 173, - (2001), s. 281-286 ISSN 0168-583X R&D Projects: GA AV ČR IAA1010819 Institutional research plan: CEZ:AV0Z1010914 Keywords : highly charged ion-surface interaction * ion-induced electron emission * angle impact effect Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.041, year: 2001

Surrey Ion Beam Centre: the EPSRC MRF for ion beam applications - 01002

International Nuclear Information System (INIS)

Webb, R.P.

2016-01-01

The SIBC (Surrey Ion Beam Centre) is an element of the Virtual Ion Beam Centre that coordinates 3 U.K. experimental facilities: SIBC (University of Surrey) for implantation and ion beam applications, Miami and MEIS facility (University of Huddersfield) and gamma ray and neutron irradiation emulation facility (University of Manchester). The SIBC works actively with industry, developing bespoke processes and services, particularly for the photonics industry and provides ion beam facilities to about 20 companies across the world. It operates a stringent quality control program and is one of the few ion beam laboratories in the world to operate under ISO 9001 certification. The equipment of SIBC is presented and some applications of ion beam analysis concerning the identification of gunshot residues, the determination of the origin of a painting, the analysis of proteins are described. Different techniques such as PIXE (Particle Induced X-ray Emission), RBS (Rutherford Backscattering Spectroscopy), NRA (Nuclear Reaction Analysis), SIMS (Secondary Ion Mass Spectrometry) are also explained in the slides of the presentation that have been added at the end of the paper

Changes of Serum Total and Free Testosterone Concentrations in Male Chronic Hemodialysis Patients with Secondary Hyperparathyroidism in Response to Cinacalcet Treatment

Directory of Open Access Journals (Sweden)

Piotr Kuczera

2016-01-01

Full Text Available Background/Aims: Calcium sensing receptor (CaSR is expressed, among others also in testis. Cinacalcet binds to the CaSR, increases sensitivity of CaSR to serum calcium and is used in the treatment of secondary hyperparathyroidism (sHPT in chronic hemodialysis patients (HDP. In most of male HDP, serum testosterone concentration is lower than in healthy males. The aim of this study was to assess the influence of six-month treatment with cinacalcet on the serum total and free testosterone concentration in male HDP with sHPT. Methods: 38 male, hemodialysed CKD patients with sHPT (PTH>300 pg/ml were enrolled into the study. In each patient serum PTH, total testosterone (TT and free testosterone (FT concentrations were assessed before the first dose of cinacalcet and then after 3 and 6 months of treatment. The results are presented as means with 95% confidence interval. Results: In 33 patients who completed the study cinacalcet treatment caused significant decrease of serum PTH from 1143 pg/ml (828 - 1458 pg/ml at the baseline, to 809 pg/ml (487 - 1132pg/ml after 3 month of treatment (p = 0.002, and to 607 pg/ml (281 - 934pg/ml; p Conclusion: Treatment with cinacalcet decreases serum total and free testosterone concentration in male hemodialysed patients with chronic kidney disease and secondary hyperparathyroidism.

Fragment ion and electron emission from C sub 6 sub 0 by fast heavy ion impact

CERN Document Server

Mizuno, T; Itoh, A; Tsuchida, H; Nakai, Y

2003-01-01

Correlation between electron emission and fragmentation of C sub 6 sub 0 was studied using 847keV Si sup + ions. Mass distribution of fragment ions, number distribution of secondary electrons, and final charge distribution of outgoing projectiles were successfully measured by means of a triple coincidence time-of-flight method. Strong correlation was observed for electron emission and fragmentation.

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

KAUST Repository

Kyriacou, Bianca; Moore, Katie L.; Paterson, David J.; De Jonge, Martin Daly; Howard, Daryl Lloyd; Stangoulis, James Constantine R; Tester, Mark A.; Lombi, E.; Johnson, Alexander A T

2014-01-01

Cereal crops accumulate low levels of iron (Fe) of which only a small fraction (5-10%) is bioavailable in human diets. Extensive co-localization of Fe in outer grain tissues with phytic acid, a strong chelator of metal ions, results in the formation of insoluble complexes that cannot be digested by humans. Here we describe the use of synchrotron X-ray fluorescence microscopy (XFM) and high resolution secondary ion mass spectrometry (NanoSIMS) to map the distribution of Fe, zinc (Zn), phosphorus (P) and other elements in the aleurone and subaleurone layers of mature grain from wild-type and an Fe-enriched line of rice (Oryza sativa L.). The results obtained from both XFM and NanoSIMS indicated that most Fe was co-localized with P (indicative of phytic acid) in the aleurone layer but that a small amount of Fe, often present as "hotspots", extended further into the subaleurone and outer endosperm in a pattern that was not co-localized with P. We hypothesize that Fe in subaleurone and outer endosperm layers of rice grain could be bound to low molecular weight chelators such as nicotianamine and/or deoxymugineic acid. © 2014.

Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry

KAUST Repository

Kyriacou, Bianca

2014-03-01

Cereal crops accumulate low levels of iron (Fe) of which only a small fraction (5-10%) is bioavailable in human diets. Extensive co-localization of Fe in outer grain tissues with phytic acid, a strong chelator of metal ions, results in the formation of insoluble complexes that cannot be digested by humans. Here we describe the use of synchrotron X-ray fluorescence microscopy (XFM) and high resolution secondary ion mass spectrometry (NanoSIMS) to map the distribution of Fe, zinc (Zn), phosphorus (P) and other elements in the aleurone and subaleurone layers of mature grain from wild-type and an Fe-enriched line of rice (Oryza sativa L.). The results obtained from both XFM and NanoSIMS indicated that most Fe was co-localized with P (indicative of phytic acid) in the aleurone layer but that a small amount of Fe, often present as "hotspots", extended further into the subaleurone and outer endosperm in a pattern that was not co-localized with P. We hypothesize that Fe in subaleurone and outer endosperm layers of rice grain could be bound to low molecular weight chelators such as nicotianamine and/or deoxymugineic acid. © 2014.

Pulmonary nodules secondary to total parenteral alimentation

International Nuclear Information System (INIS)

Landry, B.A.; Melhem, R.E.

1989-01-01

A seven-year-old male, who had a retroperitoneal alveolar rhabdomyosarcoma and was on total parenteral alimentation (TPN) developed muliple pulmonary nodules, indistinguishable from metastases. These proved to be multiple lipid emboli on open biopsy. (orig.)

Design study of primary ion provider for relativistic heavy ion collider electron beam ion source.

Science.gov (United States)

Kondo, K; Kanesue, T; Tamura, J; Okamura, M

2010-02-01

Brookhaven National Laboratory has developed the new preinjector system, electron beam ion source (EBIS) for relativistic heavy ion collider (RHIC) and National Aeronautics and Space Administration Space Radiation Laboratory. Design of primary ion provider is an essential problem since it is required to supply beams with different ion species to multiple users simultaneously. The laser ion source with a defocused laser can provide a low charge state and low emittance ion beam, and is a candidate for the primary ion source for RHIC-EBIS. We show a suitable design with appropriate drift length and solenoid, which helps to keep sufficient total charge number with longer pulse length. The whole design of primary ion source, as well as optics arrangement, solid targets configuration and heating about target, is presented.

Influence of ion beam and geometrical parameters on properties of Si thin films grown by Ar ion beam sputtering

Energy Technology Data Exchange (ETDEWEB)

Bundesmann, Carsten; Feder, Rene; Neumann, Horst [Leibniz-Institut fuer Oberflaechenmodifizierung e.V., Leipzig (Germany)

2012-07-01

Ion beam sputtering (IBS) offers, in contrast to other physical vapour deposition techniques, such as magnetron sputtering or electron beam evaporation, the opportunity to change the properties of the layer forming particles (sputtered and scattered particles) by varying ion beam parameters (ion species, ion energy) and geometrical parameters (ion incidence angle, emission angle). Consequently, these effects can be utilized to tailor thin film properties [1]. The goal is to study systematically the correlations between the primary and secondary parameters and, at last, the effects on the properties of Si thin films, such as optical properties, stress, surface topography and composition. First experimental results are presented for Ar-ion sputtering of Si.

Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen flooding

International Nuclear Information System (INIS)

Liu, R.; Wee, A.T.S.

2004-01-01

Following the increasingly stringent requirements in the characterization of sub-micron IC devices, an understanding of the various factors affecting ultra shallow depth profiling in secondary ion mass spectrometry (SIMS) has become crucial. Achieving high depth resolution (of the order of 1 nm) is critical in the semiconductor industry today, and various methods have been developed to optimize depth resolution. In this paper, we will discuss ultra shallow SIMS depth profiling using B and Ge delta-doped Si samples using low energy 0.5 keV O 2 + primary beams. The relationship between depth resolution of the delta layers and surface topography measured by atomic force microscopy (AFM) is studied. The effect of oxygen flooding and sample rotation, used to suppress surface roughening is also investigated. Oxygen flooding was found to effectively suppress roughening and gives the best depth resolution for B, but sample rotation gives the best resolution for Ge. Possible mechanisms for this are discussed

Ion-beam apparatus and method for analyzing and controlling integrated circuits

Science.gov (United States)

Campbell, Ann N.; Soden, Jerry M.

1998-01-01

An ion-beam apparatus and method for analyzing and controlling integrated circuits. The ion-beam apparatus comprises a stage for holding one or more integrated circuits (ICs); a source means for producing a focused ion beam; and a beam-directing means for directing the focused ion beam to irradiate a predetermined portion of the IC for sufficient time to provide an ion-beam-generated electrical input signal to a predetermined element of the IC. The apparatus and method have applications to failure analysis and developmental analysis of ICs and permit an alteration, control, or programming of logic states or device parameters within the IC either separate from or in combination with applied electrical stimulus to the IC for analysis thereof. Preferred embodiments of the present invention including a secondary particle detector and an electron floodgun further permit imaging of the IC by secondary ions or electrons, and allow at least a partial removal or erasure of the ion-beam-generated electrical input signal.

Li2SnO3 derived secondary Li-Sn alloy electrode for lithium-ion batteries

International Nuclear Information System (INIS)

Zhang, D.W.; Zhang, S.Q.; Jin, Y.; Yi, T.H.; Xie, S.; Chen, C.H.

2006-01-01

As a possible high-capacity Li-ion battery anode material, Li 2 SnO 3 was prepared via a solid-state reaction route and a sol-gel route, separately. Its electrochemical performance was tested in coin-type cells with metallic Li as the counter electrode. The results show that the sol-gel derived Li 2 SnO 3 has uniform nano-sized particles (200-300 nm) and can deliver a better reversible capacity (380 mAh/g after 50 cycles in the voltage window of 0-1 V) than that from the solid-state reaction route. The characterizations by means of galvanostatic cycling, cyclic voltammetry and ex situ X-ray diffraction indicate that the electrochemical process of the Li 2 SnO 3 lithiation proceeds with an initial structural reduction of the composite oxide into Sn-metal and Li 2 O followed by a reversible Li-Sn alloy formation in the Li 2 O matrix. Due to the buffer role of the Li 2 O matrix, the reversibility of the secondary Li-Sn alloy electrode is largely secured

H passivation of Li on Zn-site in ZnO: Positron annihilation spectroscopy and secondary ion mass spectrometry

Science.gov (United States)

Johansen, K. M.; Zubiaga, A.; Tuomisto, F.; Monakhov, E. V.; Kuznetsov, A. Yu.; Svensson, B. G.

2011-09-01

The interaction of hydrogen (H) with lithium (Li) and zinc vacancies (VZn) in hydrothermally grown n-type zinc oxide (ZnO) has been investigated by positron annihilation spectroscopy (PAS) and secondary ion mass spectrometry. Li on Zn-site (LiZn) is found to be the dominant trap for migrating H atoms, while the trapping efficiency of VZn is considerably smaller. After hydrogenation, where the LiZn acceptor is passivated via formation of neutral LiZn-H pairs, VZn occurs as the prime PAS signature and with a concentration similar to that observed in nonhydrogenated Li-poor samples. Despite a low efficiency as an H trap, the apparent concentration of VZn in Li-poor samples decreases after hydrogenation, as detected by PAS, and evidence for formation of the neutral VZnH2 complex is presented.

Corrosion behaviour of low energy, high temperature nitrogen ion ...

Indian Academy of Sciences (India)

primary ions were used and negative secondary ions were detected. A difference in the distribution of the CrN and the alleged N signal was observed and attributed to CrN acting as a diffusion barrier for nitrogen diffusion. It may be noted here that nitrogen does not form stable elemental negative ions [2] and is thus.

Secondary organic carbon quantification and source apportionment of PM10 in Kaifeng, China

Institute of Scientific and Technical Information of China (English)

WU Lin; FENG Yinchang; WU Jianhui; ZHU Tan; BI Xiaohui; HAN Bo; YANG Weihong; YANG Zhiqiang

2009-01-01

During 2005, the filter samples of ambient PM10 from five sites and the source samples of particulate matter were collected in Kaifeng, Henan province of China. Nineteen elements, water-soluble ions, total carbon (TC) and organic carbon (OC) contained in samples were analyzed. Seven contributive source types were identified and their contributions to ambient PM10 were estimated by chemical mass balance (CMB) receptor model. Weak associations between the concentrations of organic carbon and element carbon (EC) were observed during the sampling periods, indicating that there was secondary organic aerosol pollution in the urban atmosphere. An indirect method of "OC/EC minimum ratio" was applied to estimate the concentration of secondary organic carbon (SOC). The results showed that SOC contributed 26.2%, 32.4% and 18.0% of TC in spring, summer-fall and winter respectively, and the annual average SOC concentration was 7.07 μg/m3, accounting for 5.73% of the total mass in ambient PM10. The carbon species concentrations in ambient PM10 were recalculated by subtracting the SOC concentrations from measured concentrations of TC and OC to increase the compatibility of source and receptor measurements for CMB model.

Carbon buildup monitoring using RBS: Correlation with secondary electrons

International Nuclear Information System (INIS)

Aguilera, E.F.; Rosales, P.; Martinez-Quiroz, E.; Murillo, G.; Fernandez, M.C.

2006-01-01

The RBS technique is applied to solve the problem of on-line monitoring of the carbon deposited on a thin backed foil under ion bombardment. An iterative method is used to reliably extract quantities such as number of projectiles and target thickness in spite of beam energy changes and detector unstabilities. Experimental values for secondary electron yields are also deduced. Results are reported for the thickness variation of thin carbon foils bombarded with carbon ions of energies between 8.95 and 13 MeV. A linear correlation of this variation is found with both, the ion fluence at target and the number of secondary electrons emitted. The correlation exists even though a wide range of beam currents, beam energies and bombarding times was used during the experiment. The measured electron yields show evidence for a change in the emission process between the original foils and the deposited layer, possibly due to a texture change

Secondary battery on cell with dual electrode. [German Patent

Energy Technology Data Exchange (ETDEWEB)

Ludwig, F A

1977-08-04

The barrier layer penetrable to alkali metal ions is in ion-conducting contact with the melted anode alkali metal on the one side and, on the other side, in ion-conducting contact with a cathode reactant of liquid electrolyte. The electrolyte is electrochemically reversibly reactive with the anode reaction component and consists of a mixture of melted polysulfide salts of the alkali metal and molten sulfur when the cell is partly discharged. The improvement on the secondary battery, according to the invention, involves electrode devices containing first and second electrodes. The first electrode is designed for battery charge; it is installed in the first section of the cathodic reaction zone and is wetted to a greater extent by the melted polysulfide than by molten sulfur. The secondary electrode is designed for battery discharge; it is installed in a second section of the cathodic reaction zone and is wetted to a greater extent by molten sulfur than by melted polysulfide.

Development of a beam ion velocity detector for the heavy ion beam probe

International Nuclear Information System (INIS)

Fimognari, P. J.; Crowley, T. P.; Demers, D. R.

2016-01-01

In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

Development of a beam ion velocity detector for the heavy ion beam probe

Energy Technology Data Exchange (ETDEWEB)

Fimognari, P. J., E-mail: PJFimognari@XanthoTechnologies.com; Crowley, T. P.; Demers, D. R. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

In an axisymmetric plasma, the conservation of canonical angular momentum constrains heavy ion beam probe (HIBP) trajectories such that measurement of the toroidal velocity component of secondary ions provides a localized determination of the poloidal flux at the volume where they originated. We have developed a prototype detector which is designed to determine the beam angle in one dimension through the detection of ion current landing on two parallel planes of detecting elements. A set of apertures creates a pattern of ion current on wires in the first plane and solid metal plates behind them; the relative amounts detected by the wires and plates determine the angle which beam ions enter the detector, which is used to infer the toroidal velocity component. The design evolved from a series of simulations within which we modeled ion beam velocity changes due to equilibrium and fluctuating magnetic fields, along with the ion beam profile and velocity dispersion, and studied how these and characteristics such as the size, cross section, and spacing of the detector elements affect performance.

Rate-dependent performance of ion chambers for particle-ID at the GSI fragment separator

Energy Technology Data Exchange (ETDEWEB)

Hucka, Jan-Paul; Allred, Timothy; Enders, Joachim [Institut fuer Kernphysik, TU Darmstadt (Germany); Gernhaeuser, Roman; Maurus, Steffen [Physik Department, TU Muenchen (Germany); Nociforo, Chiara; Pietri, Stephane; Prochazka, Andrej [GSI Helmholtzzentrum fuer Schwerionenforschung (Germany)

2015-07-01

At the GSI Fragment Separator (FRS), multi-sampling ion chambers (MUSIC) employing a Frisch grid are used for charge identification of secondary ion beams. At the FAIR Super-FRS, higher rates are expected, and an event-by-event determination of the charge of secondary ions will be needed at rates of several 100000 events per second. The comparison of results from test measurements for the MUSIC performance with that of a recently constructed tilted-electrode gas ion chamber (TEGIC), which was designed similar to the one discussed, is presented.

Kinetic plasma simulation of ion beam extraction from an ECR ion source

International Nuclear Information System (INIS)

Elliott, S.M.; White, E.K.; Simkin, J.

2012-01-01

Designing optimized ECR (electron cyclotron resonance) ion beam sources can be streamlined by the accurate simulation of beam optical properties in order to predict ion extraction behavior. The complexity of these models, however, can make PIC-based simulations time-consuming. In this paper, we first describe a simple kinetic plasma finite element simulation of extraction of a proton beam from a permanent magnet hexapole ECR ion source. Second, we analyze the influence of secondary electrons generated by ion collisions in the residual gas on the space charge of a proton beam of a dual-solenoid ECR ion source. The finite element method (FEM) offers a fast modeling environment, allowing analysis of ion beam behavior under conditions of varying current density, electrode potential, and gas pressure. The new version of SCALA/TOSCA v14 permits the making of simulations in tens of minutes to a few hours on standard computer platforms without the need of particle-in-cell methods. The paper is followed by the slides of the presentation. (authors)

Analysis of hopanes and steranes in single oil-bearing fluid inclusions using time-of-flight secondary ion mass spectrometry (ToF-SIMS).

Science.gov (United States)

Siljeström, S; Lausmaa, J; Sjövall, P; Broman, C; Thiel, V; Hode, T

2010-01-01

Steranes and hopanes are organic biomarkers used as indicators for the first appearance of eukaryotes and cyanobacteria on Earth. Oil-bearing fluid inclusions may provide a contamination-free source of Precambrian biomarkers, as the oil has been secluded from the environment since the formation of the inclusion. However, analysis of biomarkers in single oil-bearing fluid inclusions, which is often necessary due to the presence of different generations of inclusions, has not been possible due to the small size of most inclusions. Here, we have used time-of-flight secondary ion mass spectrometry (ToF-SIMS) to monitor in real time the opening of individual inclusions trapped in hydrothermal veins of fluorite and calcite and containing oil from Ordovician source rocks. Opening of the inclusions was performed by using a focused C(60)(+) ion beam and the in situ content was precisely analysed for C(27)-C(29) steranes and C(29)-C(32) hopanes using Bi(3)(+) as primary ions. The capacity to unambiguously detect these biomarkers in the picoliter amount of crude oil from a single, normal-sized (15-30 mum in diameter) inclusion makes the approach promising in the search of organic biomarkers for life's early evolution on Earth.

Neutron generator tube ion source control apparatus

International Nuclear Information System (INIS)

Bridges, J.R.

1982-01-01

A pulsed neutron well logging system includes a neutron generator tube of the deuterium-tritium accelerator type and an ion source control apparatus providing extremely sharply time-defined neutron pulses. A low voltage control pulse supplied to an input by timing circuits turns a power FET on via a buffer-driver whereby a 2000 volt pulse is produced in the secondary of a pulse transformer and applied to the ion source of the tube. A rapid fall in this ion source control pulse is ensured by a quenching circuit wherein a one-shot responds to the falling edge of the control pulse and produces a 3 microsecond delay to compensate for the propagation delay. A second one-shot is triggered by the falling edge of the output of the first one-shot and gives an 8 microsecond pulse to turn on the power FET which, via an isolation transformer turns on a series-connected transistor to ground the secondary of the pulse transformer and the ion source. (author)

Threshold photoelectron spectroscopy and photoionization total ion yield spectroscopy of simple organic acids, aldehydes, ketones and amines

International Nuclear Information System (INIS)

Yencha, Andrew J; Malins, Andrew E R; Siggel-King, Michele R F; Eypper, Marie; King, George C

2009-01-01

We have initiated a research program to investigate the ionization behavior of some simple organic molecules containing the carboxyl group (R 2 C=O), where R could be H, OH, NH 2 , or CH 3 or other aliphatic or aromatic carbon groups, using threshold photoelectron spectroscopy and photoionization total ion yield spectroscopy. We report here on the simplest organic acid, formic acid, and two simple aldehydes: acetaldehyde and the simplest unsaturated aldehyde, 2-propenal (acrolein). The objective of this study was to characterize the valence cationic states of these molecules with vibrational structural resolution.

Performance of the K+ ion diode in the 2 MV injector for heavy ion fusion

Science.gov (United States)

Bieniosek, F. M.; Henestroza, E.; Kwan, J. W.

2002-02-01

Heavy ion beam inertial fusion driver concepts depend on the availability and performance of high-brightness high-current ion sources. Surface ionization sources have relatively low current density but high brightness because of the low temperature of the emitted ions. We have measured the beam profiles at the exit of the injector diode, and compared the measured profiles with EGUN and WARP-3D predictions. Spherical aberrations are significant in this large aspect ratio diode. We discuss the measured and calculated beam size and beam profiles, the effect of aberrations, quality of vacuum, and secondary electron distributions on the beam profile.

Secondary electron emission in nanostructured porous silicon

Energy Technology Data Exchange (ETDEWEB)

Ruano, G D; Ferron, J; Koropecki, R R, E-mail: gdruano@ceride.gov.a [INTEC-UNL-CONICET, Gueemes 3450 - 3000 Santa Fe (Argentina)

2009-05-01

We studied the reversible reduction induced by ion bombardment of the secondary electron emission (SEE) yield. This effect has been modelled as due to changes in dynamically sustained dipoles related with ions and electrons penetration ranges. Such charge configuration precludes the escape of electrons from the nanoporous silicon, making the SEE dependent on the flux of impinging ions. Since this dipolar momentum depends on the electric conduction of the porous medium, by controlled oxidation of the nanoporous structure we change the conduction features of the sample, studying the impact on the SEE reduction effect. Li ion bombardment was also used with the intention of changing the parameters determining the effect. FT-IR and Auger electron spectroscopy were used to characterize the oxidation degree of the samples at different depth scales

Analyses of the Secondary Particle Radiation and the DNA Damage it Causes to Human Keratinocytes

Energy Technology Data Exchange (ETDEWEB)

Lebel E. A.; Tafrov S.; Rusek, A.; Sivertz, M. B.; Yip, K.; Thompson, K. H.

2011-11-01

High-energy protons, and high mass and energy ions, along with the secondary particles they produce, are the main contributors to the radiation hazard during space explorations. Skin, particularly the epidermis, consisting mainly of keratinocytes with potential for proliferation and malignant transformation, absorbs the majority of the radiation dose. Therefore, we used normal human keratinocytes to investigate and quantify the DNA damage caused by secondary radiation. Its manifestation depends on the presence of retinol in the serum-free media, and is regulated by phosphatidylinositol 3-kinases. We simulated the generation of secondary radiation after the impact of protons and iron ions on an aluminum shield. We also measured the intensity and the type of the resulting secondary particles at two sample locations; our findings agreed well with our predictions. We showed that secondary particles inflict DNA damage to different extents, depending on the type of primary radiation. Low-energy protons produce fewer secondary particles and cause less DNA damage than do high-energy protons. However, both generate fewer secondary particles and inflict less DNA damage than do high mass and energy ions. The majority of cells repaired the initial damage, as denoted by the presence of 53BPI foci, within the first 24 hours after exposure, but some cells maintained the 53BP1 foci longer.

Absolute measurement of the total ion-drag force on a single plasma-confined microparticle at the void edge under microgravity conditions

NARCIS (Netherlands)

Beckers, J.; Trienekens, D.J.M.; Kroesen, G.M.W.

2013-01-01

We present an absolute measurement of the total ion-drag force on one single microparticle at the edge of the dust free region in low pressure complex plasmas: the void. In order to do so, the particle confinement position was monitored as a function of the gas pressure for two particle sizes under

Dynamical processes in heavy ion reactions

International Nuclear Information System (INIS)

Blann, M.; Remington, B.A.

1988-01-01

In this report I review the physical assumptions of the Boltzmann Master Equation (BME). Comparisons of the model with experimental neutron spectra gated on evaporation residues for a range of incident projectile energies and masses are presented; next, I compare n spectra gated on projectile-like fragments, followed by comparisons with ungated, inclusive proton spectra. I will then consider secondary effects from the nucleon-nucleon processes involved in the heavy ion relaxation processes, specifically the high energy γ-rays which have been observed at energies up to 140 MeV in collisions of heavy ions of 20/endash/84 MeV/μ. Another secondary effect, subthreshold pion production, was covered in the XVII School and will not be repeated. 39 refs., 16 figs

Techniques for improving material fidelity and contrast consistency in secondary electron mode helium ion microscope (HIM) imaging

Science.gov (United States)

Thompson, William; Stern, Lewis; Ferranti, Dave; Huynh, Chuong; Scipioni, Larry; Notte, John; Sanford, Colin

2010-06-01

Recent helium ion microscope (HIM) imaging studies have shown the strong sensitivity of HIM induced secondary electron (SE) yields [1] to the sample physical and chemical properties and to its surface topography. This SE yield sensitivity is due to the low recoil energy of the HIM initiated electrons and their resulting short mean free path. Additionally, a material's SE escape probability is modulated by changes in the material's work function and surface potential. Due to the escape electrons' roughly 2eV mean energy and their nanometer range mean free path, HIM SE mode image contrast has significant material and surface sensitivity. The latest generation of HIM has a 0.35 nanometer resolution specification and is equipped with a plasma cleaning process to mitigate the effects of hydrocarbon contamination. However, for surfaces that may have native oxide chemistries influencing the secondary electron yield, a new process of low energy, shallow angle argon sputtering, was evaluated. The intent of this work was to study the effect of removing pre-existing native oxides and any in-situ deposited surface contaminants. We will introduce the sputter yield predictions of two established computer models and the sputter yield and sample modification forecasts of the molecular dynamics program, Kalypso. We will review the experimental technique applied to copper samples and show the copper grain contrast improvement that resulted when argon cleaned samples were imaged in HIM SE mode.

Nanomaterials-Enhanced Electrically Switched Ion Exchange Process for Water Treatment

International Nuclear Information System (INIS)

Lin, Yuehe; Choi, Daiwon; Wang, Jun; Bontha, Jagannadha R.

2009-01-01

The objective of our work is to develop an electrically switched ion exchange (ESIX) system based on conducting polymer/carbon nanotube (CNT) nanocomposites as a new and cost-effective approach for removal of radioactive cesium, chromate, and perchlorate from contaminated groundwater. The ESIX technology combines ion exchange and electrochemistry to provide a selective, reversible method for the removal of target species from wastewater. In this technique, an electroactive ion exchange layer is deposited on a conducting substrate, and ion uptake and elution are controlled directly by modulation of the potential of the layer. ESIX offers the advantages of highly-efficient use of electrical energy combined with no secondary waste generation. Recently, we have improved upon the ESIX process by modifying the conducting substrate with carbon nanotubes prior to the deposition of the electroactive ion exchanger. The nanomaterial-based electroactive ion exchange technology will remove cesium-137, chromate, and perchlorate rapidly from wastewater. The high porosity and high surface area of the electroactive ion exchange nanocomposites results in high loading capacity and minimize interferences for non-target species. Since the ion adsorption/desorption is controlled electrically without generating a secondary waste, this electrically active ion exchange process is a green process technology that will greatly reduce operating costs

Ion plasma electron gun

International Nuclear Information System (INIS)

Wakalopulos, G.

1976-01-01

In the disclosed electron gun positive ions generated by a hollow cathode plasma discharge in a first chamber are accelerated through control and shield grids into a second chamber containing a high voltage cold cathode. These positive ions bombard a surface of the cathode causing the cathode to emit secondary electrons which form an electron beam having a distribution adjacent to the cathode emissive surface substantially the same as the distribution of the ion beam impinging upon the cathode. After passing through the grids and the plasma discharge chamber, the electron beam exits from the electron gun via a foil window. Control of the generated electron beam is achieved by applying a relatively low control voltage between the control grid and the electron gun housing (which resides at ground potential) to control the density of the positive ions bombarding the cathode

Ion optics of a new time-of-flight mass spectrometer for quantitative surface analysis

International Nuclear Information System (INIS)

Veryovkin, Igor V.; Calaway, Wallis F.; Pellin, Michael J.

2004-01-01

A new time-of-flight instrument for quantitative surface analysis was developed and constructed at Argonne National Laboratory. It implements ion sputtering and laser desorption for probing analyzed samples and can operate in regimes of secondary neutral mass spectrometry with laser post-ionization and secondary ion mass spectrometry. The instrument incorporates two new ion optics developments: (1) 'push-pull' front end ion optics and (2) focusing and deflecting lens. Implementing these novel elements significantly enhance analytical capabilities of the instrument. Extensive three-dimensional computer simulations of the instrument were conducted in SIMION 3D (c) to perfect its ion optics. The operating principles of the new ion optical systems are described, and a scheme of the new instrument is outlined together with its operating modes

Determination of chemical composition, total phenolic content and antioxidant activity of xylanthemum macropodum

International Nuclear Information System (INIS)

Samiullah, A.; Tareen, R.B.; Khan, N.; Akber, A.; Ali, I.; Khan, A.K.

2017-01-01

Evaluation of the phytochemistry, total phenolic content and antioxidant activity of the endemic plant of northern Balochistan Xylanthemum Macropodum of the Asteraceae family, is reported for the first time in this document. Chemical composition of Xylanthemum Macropodum was determined using well-established chemical tests and modern spectroscopic techniques. Extracts were taken from the whole plant using methanol and the extracts were tested for phytochemicals (secondary metabolites), total phenolic content (TPC) and antioxidant activity. The phytochemical (biochemical) examination of Xylanthemum Macropodum exposed the presence of alkaloids, phenols, steroids, flavonoids, tannins, terpenoids, saponins, coumarins, carbohydrates, cardiac glycosides, reducing sugars, and quinines. TPC of crude methanolic extract (CME) of plant was determined using Folin-Ciocalteu's reagent. The TPC determined was 256mg of tannic acid Eq/g of extract. Antioxidant activities were determined spectrophotometrically using the DPPH assay and Ferric ion (Fe/sup +3/) reducing antioxidant power assay. The potency of the DPPH assay of Xylanthemum Macropodum extract was 68% for the 0.10 mg/ml concentration and the FRAP value of the extract was 3.368 mmol Fe/sup +2//g of extract. Xylanthemum Macropodum has proved to be very rich in secondary metabolites, natural phenolics and has a very potent antioxidant activity. (author)

Secondary reactions as a tool to produce exotic nuclei

International Nuclear Information System (INIS)

Dufour, J.P.; Fleury, A.; Bimbot, R.

1980-01-01

The possibility of using secondary reactions as tool to produce new isotopes is considered. This question is renewed with the emergence of intense beams of energetic heavy ions in the range of 20 to 100 MeV/nucleon. Three different methods are considered. They involve either the 'in situ' production of a secondary radioactive target, which interacts with the primary beam, or the production of a radioactive secondary beam by an inverse fusion or a fragmentation process. Very heavy or very neutron deficient isotopes can be produced by these methods

Large geometry secondary ion mass spectrometry (LG-SIMS) for the enhancement of nuclear safeguards applications

International Nuclear Information System (INIS)

Helberg, P.M.L.; Wallenius, M.; Vincent, C.; Albert, N.; Peres, P.; Truyens, J.

2013-01-01

A new LG-SIMS (Large Geometry Secondary Ion Mass Spectrometry) laboratory is currently being established at the Joint Research Centre, the Institute of Transuranium Elements for the purpose of improving the analytical capabilities within the European Commission. The laboratory will mainly be used for analysing uranium bearing aerosol particles collected on cotton swipes from nuclear Safeguards inspections but it will also be used for Nuclear Forensics and other Safeguards related applications. Until recently, this type of analysis has predominantly been performed using the small geometry CAMECA IMS 3F-7F instrument series. These instruments provide both particle screening and isotope ratio capabilities. The performance of these instruments was however limited by the occurrence of isobaric interferences, in particular for the minor isotopes ( 234 U, 236 U), that could not be resolved without compromising the transmission of the instrument. A recent breakthrough to solve this problem has been the implementation of Large Geometry SIMS, the CAMECA 1270 / 1280 / 1280-HR models, for this type of analysis. This instrument has originally been developed for geosciences applications requiring both high transmission and high mass resolution capabilities. This came out to be a key instrumental advantage also for uranium particle analyses, as it allows efficient removal of common molecular interferences with minimum loss in transmission. Furthermore an electrostatic ion optical device has been added for increasing the mass dispersion which allows the simultaneous detection of all uranium isotopes. The Automated Particle Measurement (APM) software has been developed to perform screening measurement in an automated mode. Combined with the APM screening software, LG-SIMS instruments greatly improve the overall performance and throughput of isotopic analyses of U particles for nuclear Safeguards purposes. The paper is followed by the slides of the presentation. (A.C.)

On the symmetry of nuclear identity between relativistic primary and secondary nuclei

International Nuclear Information System (INIS)

Lerman, L.

2002-01-01

Do secondary hadrons, freshly created in the collision of a relativistic heavy ion nucleus, have the same properties of nuclear interaction as those of an otherwise identical primary? To explore this question two types of experiments were performed, one in fact and one in fiction. The first was the scanning and measurement of an emulsion stack exposed to a 1.8 A GeV 40 Ar beam from Lawrence Berkeley Laboratory's Bevatron. This emulsion experiment is the first full-stack scan of a major exposure ever performed and includes 1418 stars of primary interactions, 1850 secondary stars, and tens of thousands of shower and slow heavily ionizing particles. As such it constitutes a dataset uniquely powerful in exploring questions of symmetry between primary and secondary populations. One of the emulsion results is the experimental determination (and to a particularly high accuracy for Z=2) that total (geometric) cross-section does not change with generation for the secondaries under study. The 'fictional' experiments are a set of Monte-Carlo simulations based on the transport code RHIP, itself built upon the results of the emulsions experiment. RHIP is designed to attack a number of problems ranging from particle physics to NASA's need to model the nuclear cascades induced by Galactic Cosmic Rays impinging on manned spacecraft. The major version of RHIP dealt with here is BFHL, a detailed modeling of a 1.8 A GeV 40 Ar beam on cylindrically symmetric sets of Cu targets. BFHL was then applied to the Copper Calorimetry Experiments also performed at Lawrence Berkeley Laboratory. The exhaustive simulation and analysis presented here shows that all but one of the variables considered can neither quantitatively nor qualitatively explain the results of the Copper Calorimetry Experiments. Amongst many others these failures of fit include all transport variables, the total cross-section (i.e. short mean free path), and a higher than normal Pt for shower particles. Instead, the Copper

HEATHER - HElium Ion Accelerator for RadioTHERapy

Energy Technology Data Exchange (ETDEWEB)

Taylor, Jordan [Huddersfield U.; Edgecock, Thomas [Huddersfield U.; Green, Stuart [Birmingham U.; Johnstone, Carol [Fermilab

2017-05-01

A non-scaling fixed field alternating gradient (nsFFAG) accelerator is being designed for helium ion therapy. This facility will consist of 2 superconducting rings, treating with helium ions (He²⁺ ) and image with hydrogen ions (H + 2 ). Currently only carbon ions are used to treat cancer, yet there is an increasing interest in the use of lighter ions for therapy. Lighter ions have reduced dose tail beyond the tumour compared to carbon, caused by low Z secondary particles produced via inelastic nuclear reactions. An FFAG approach for helium therapy has never been previously considered. Having demonstrated isochronous acceleration from 0.5 MeV to 900 MeV, we now demonstrate the survival of a realistic beam across both stages.

KNO type scaling of secondary charged particles produced in 4.5 a GeV 12C-nucleus collisions

International Nuclear Information System (INIS)

Khushnood, H.; Singh, Prithipal; Shukla, Praveen Prakash; Saleem Khan, M.

2011-01-01

Study of the secondary charged particles produced in heavy ion collisions is attracting a great deal of attention during the recent years. It is reported that the multiplicity distribution of secondary charged particles produced in high energy hadron-hadron and hadron-nucleus collisions Obey Koba, Nielson and Olesen (KNO) scaling. However, no attention has been paid to study the nature of the multiplicity distribution of secondary charged particles produced in relativistic heavy ions reactions. Thus, an attempt has been made to study the multiplicity distribution of secondary charged particles produced in 4.5 A GeV 12 C-nucleus interactions

Production of and studies with secondary radioactive ion beams at Lise

International Nuclear Information System (INIS)

Mueller, A.C.

1990-01-01

The doubly achromatic spectrometer LISE, installed at GANIL has delivered secondary radioactive beams for the past 6 years. Essentially, it consists of by two dipole magnets selecting (in A/Z) and refocusing (achromatically) the projectile-like fragment-beams emitted at 0 0 . Important features of LISE and selected experimental results will be discussed. LISE was substantially upgraded, recently, by adding a Wien-filter, providing secondary radioactive beams of still increased intensity and isotopic purity. (6 figs)

Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis.

Science.gov (United States)

Dague, Etienne; Delcorte, Arnaud; Latgé, Jean-Paul; Dufrêne, Yves F

2008-04-01

Understanding the surface properties of microbial cells is a major challenge of current microbiological research and a key to efficiently exploit them in biotechnology. Here, we used three advanced surface analysis techniques with different sensitivity, probing depth, and lateral resolution, that is, in situ atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry, to gain insight into the surface properties of the conidia of the human fungal pathogen Aspergillus fumigatus. We show that the native ultrastructure, surface protein and polysaccharide concentrations, and amino acid composition of three mutants affected in hydrophobin production are markedly different from those of the wild-type, thereby providing novel insight into the cell wall architecture of A. fumigatus. The results demonstrate the power of using multiple complementary techniques for probing microbial cell surfaces.

Combining combing and secondary ion mass spectrometry to study DNA on chips using 13C and 15N labeling [version 1; referees: 2 approved

Directory of Open Access Journals (Sweden)

Armelle Cabin-Flaman

2016-06-01

Full Text Available Dynamic secondary ion mass spectrometry (D-SIMS imaging of combed DNA – the combing, imaging by SIMS or CIS method – has been developed previously using a standard NanoSIMS 50 to reveal, on the 50 nm scale, individual DNA fibers labeled with different, non-radioactive isotopes in vivo and to quantify these isotopes. This makes CIS especially suitable for determining the times, places and rates of DNA synthesis as well as the detection of the fine-scale re-arrangements of DNA and of molecules associated with combed DNA fibers. Here, we show how CIS may be extended to 13C-labeling via the detection and quantification of the 13C14N- recombinant ion and the use of the 13C:12C ratio, we discuss how CIS might permit three successive labels, and we suggest ideas that might be explored using CIS.

Total iodine quantification in fluids and tissues from iodine- or iodide-supplemented rats by ion chromatography following microwave-assisted digestion.

Science.gov (United States)

Delgado, Guadalupe; Muñoz-Torres, Carolina; Orozco-Esquivel, Teresa; Anguiano, Brenda; Aceves, Carmen

2015-03-01

Iodine is a crucial component of thyroid hormones, and several reports have shown that iodine per se is implicated in the physiopathology of other organs. Innovative ion chromatography detection following a four-step temperature ramp microwave digestion in 25-50 mM nitric acid was developed to measure total iodine in biological fluids and tissue samples from female Sprague-Dawley rats supplemented with 0.05% molecular iodine (I2) or 0.05% potassium iodide (I(-)) in drinking water. The reported method allows the measurement of total iodine with a limit of quantification of 13.7 μg L(-1), recoveries of 96.3-100.3%, and intra- and inter-assay variations, of 3.5% and 7.4% respectively. Analysis of biological fluids showed that after 48 hours, iodine-supplemented animals exhibited significantly higher levels of total iodine in both serum and urine compared with those supplemented with iodide. The half-life of iodine in serum and urine measured over the first 48 h showed similar patterns for both the I2 (7.89 and 7.76 hours) and I(-) (8.27 and 8.90 hours) supplements. Differential uptake patterns were observed in tissues after 6 days of supplements, with I(-) preferentially retained by thyroid, lactating mammary gland, and milk, and a slightly but significantly higher capture of I2 in pituitary, ovary, and virgin mammary gland. We developed a rapid, selective, and accurate digestion method to process fluid and tissue samples that permits reproducible measurements of total iodine by ion chromatography; iodine or iodide supplement show a similar serum and urine half-life, but organ-specific uptake depends on the chemical form of the iodine supplement.

N2 Dissociation In The Mesosphere Due To Secondary Electrons During A Solar Proton Event: The Effect On Atomic Nitrogen and Nitric Oxide

Science.gov (United States)

Verronen, P. T.; Shematovich, V. I.; Bisikalo, D. V.; Turunen, E.; Ulich, Th.

Solar proton events have an effect on the middle atmospheric odd nitrogen chem- istry. During a solar proton event high energy protons enter Earth's middle atmosphere where they ionize ambient gas. Ionization leads to production of atomic nitrogen, and further to production of nitric oxide, through ion chemistry. In addition, ionization processes produce secondary electrons that, if possessing 9.76 eV or more energy, dissociate N2 providing an additional source of atomic nitrogen. We have calculated mesospheric N2 dissociation rate due to secondary electrons dur- ing a solar proton event. Further, we have studied the effect on atomic nitrogen and nitric oxide at altitudes between 50 and 90 km. It was found that N2 is efficiently dis- sociated in the lower mesosphere by secondary electrons, with rates up to 103 cm-3 s-1 at 50 km. Thus, secondary electrons significantly add to odd nitrogen produc- tion. As a result of N2 dissociation, atomic nitrogen is greatly enhanced in both N(4S) and N(2D) states by 259% and 1220% maximum increases at 50 km, respectively. This further leads to a maximum increase of 16.5% in NO concentration at 61 km via chemical reactions. In our study a Monte Carlo model was used to calculate the total ionization rate and secondary electrons flux due to precipitating protons. These where then used as input to a detailed ion and neutral chemistry model and a steady-state solution was calcu- lated for two cases: With and without N2 dissociation due to secondary electrons.

A novel approach to electron data background treatment in an online wide-angle spectrometer for laser-accelerated ion and electron bunches

Science.gov (United States)

Lindner, F. H.; Bin, J. H.; Englbrecht, F.; Haffa, D.; Bolton, P. R.; Gao, Y.; Hartmann, J.; Hilz, P.; Kreuzer, C.; Ostermayr, T. M.; Rösch, T. F.; Speicher, M.; Parodi, K.; Thirolf, P. G.; Schreiber, J.

2018-01-01

Laser-based ion acceleration is driven by electrical fields emerging when target electrons absorb laser energy and consecutively leave the target material. A direct correlation between these electrons and the accelerated ions is thus to be expected and predicted by theoretical models. We report on a modified wide-angle spectrometer, allowing the simultaneous characterization of angularly resolved energy distributions of both ions and electrons. Equipped with online pixel detectors, the RadEye1 detectors, the investigation of this correlation gets attainable on a single shot basis. In addition to first insights, we present a novel approach for reliably extracting the primary electron energy distribution from the interfering secondary radiation background. This proves vitally important for quantitative extraction of average electron energies (temperatures) and emitted total charge.

Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

Science.gov (United States)

Michałowski, P. P.; Pasternak, I.; Strupiński, W.

2018-01-01

In this study, we demonstrate that graphene grown on Ge does not contain any copper contamination, and identify some of the errors affecting the accuracy of commonly used measurement methods. Indeed, one of these, the secondary ion mass spectrometry (SIMS) technique, reveals copper contamination in Ge-based graphene but does not take into account the effect of the presence of the graphene layer. We have shown that this layer increases negative ionization significantly, and thus yields false results, but also that the graphene enhances, by an order of two, the magnitude of the intensity of SIMS signals when compared with a similar graphene-free sample, enabling much better detection limits. This forms the basis of a new measurement procedure, graphene enhanced SIMS (GESIMS) (pending European patent application no. EP 16461554.4), which allows for the precise estimation of the realistic distribution of dopants and contamination in graphene. In addition, we present evidence that the GESIMS effect leads to unexpected mass interferences with double-ionized species, and that these interferences are negligible in samples without graphene. The GESIMS method also shows that graphene transferred from Cu results in increased copper contamination.

Secondary electron emission from 0.5--2.5-MeV protons and deuterons

International Nuclear Information System (INIS)

Thornton, T.A.; Anno, J.N.

1977-01-01

Measurement of the secondary electron currents leaving Al, V, Fe, 316 stainless steel, Nb, and Mo foils undergoing 0.5--2.5-MeV proton and deuteron bombardment were made to determine the secondary electron emission ratios for these ions. The measured secondary electron yields were of the order of 1.0, with the deuterons producing generally higher yields than the protons

Recoil ions

International Nuclear Information System (INIS)

Cocke, C.L.; Olson, R.E.

1991-01-01

The collision of a fast moving heavy ion with a neutral atomic target can produce very highly charged but slowly moving target ions. This article reviews experimental and theoretical work on the production and use of recoil ions beyond the second ionization state by beams with specific energies above 0.5 MeV/amu. A brief historical survey is followed by a discussion of theoretical approaches to the problem of the removal of many electrons from a neutral target by a rapid, multiply charged projectile. A discussion of experimental techniques and results for total and differential cross sections for multiple ionization of atomic and molecular targets is given. Measurements of recoil energy are discussed. The uses of recoil ions for in situ spectroscopy of multiply charged ions, for external beams of slow, highly charged ions and in ion traps are reviewed. Some possible future opportunities are discussed. (orig.)

Measurements of secondary neutrons producted from thick targets bombarded by heavy ions

Energy Technology Data Exchange (ETDEWEB)

Kurosawa, T.; Nakamura, T. [Tohoku Univ., Sendai (Japan). Cyclotron and Radioisotope Center; Nakao, N.; Shibata, T.; Uwamino, Y.; Nakanishi, N.; Fukumura, A.; Kumamoto, Y.

1997-03-01

We measured neutron angular and energy distributions from high energy heavy ions stopping in targets of carbon, aluminum, copper and lead at HIMAC. These spectra are much harder for the lighter target nucleus like carbon. This means that the momentum transfer in the forward direction from heavy ion beam to lighter nuclei is much higher than that to heavier nuclei. (author)

Nanostructured Electrolytes for Stable Lithium Electrodeposition in Secondary Batteries

KAUST Repository

Tu, Zhengyuan; Nath, Pooja; Lu, Yingying; Tikekar, Mukul D.; Archer, Lynden A.

2015-01-01

© 2015 American Chemical Society. ConspectusSecondary batteries based on lithium are the most important energy storage technology for contemporary portable devices. The lithium ion battery (LIB) in widespread commercial use today is a compromise

Multi-dimensional TOF-SIMS analysis for effective profiling of disease-related ions from the tissue surface.

Science.gov (United States)

Park, Ji-Won; Jeong, Hyobin; Kang, Byeongsoo; Kim, Su Jin; Park, Sang Yoon; Kang, Sokbom; Kim, Hark Kyun; Choi, Joon Sig; Hwang, Daehee; Lee, Tae Geol

2015-06-05

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) emerges as a promising tool to identify the ions (small molecules) indicative of disease states from the surface of patient tissues. In TOF-SIMS analysis, an enhanced ionization of surface molecules is critical to increase the number of detected ions. Several methods have been developed to enhance ionization capability. However, how these methods improve identification of disease-related ions has not been systematically explored. Here, we present a multi-dimensional SIMS (MD-SIMS) that combines conventional TOF-SIMS and metal-assisted SIMS (MetA-SIMS). Using this approach, we analyzed cancer and adjacent normal tissues first by TOF-SIMS and subsequently by MetA-SIMS. In total, TOF- and MetA-SIMS detected 632 and 959 ions, respectively. Among them, 426 were commonly detected by both methods, while 206 and 533 were detected uniquely by TOF- and MetA-SIMS, respectively. Of the 426 commonly detected ions, 250 increased in their intensities by MetA-SIMS, whereas 176 decreased. The integrated analysis of the ions detected by the two methods resulted in an increased number of discriminatory ions leading to an enhanced separation between cancer and normal tissues. Therefore, the results show that MD-SIMS can be a useful approach to provide a comprehensive list of discriminatory ions indicative of disease states.

The differential role of human macrophage in triggering secondary bystander effects after either gamma-ray or carbon beam irradiation.

Science.gov (United States)

Dong, Chen; He, Mingyuan; Tu, Wenzhi; Konishi, Teruaki; Liu, Weili; Xie, Yuexia; Dang, Bingrong; Li, Wenjian; Uchihori, Yukio; Hei, Tom K; Shao, Chunlin

2015-07-10

The abscopal effect could be an underlying factor in evaluating prognosis of radiotherapy. This study established an in vitro system to examine whether tumor-generated bystander signals could be transmitted by macrophages to further trigger secondary cellular responses after different irradiations, where human lung cancer NCI-H446 cells were irradiated with either γ-rays or carbon ions and co-cultured with human macrophage U937 cells, then these U937 cells were used as a bystander signal transmitter and co-cultured with human bronchial epithelial cells BEAS-2B. Results showed that U937 cells were only activated by γ-irradiated NCI-H446 cells so that the secondary injuries in BEAS-2B cells under carbon ion irradiation were weaker than γ-rays. Both TNF-α and IL-1α were involved in the γ-irradiation induced secondary bystander effect but only TNF-α contributed to the carbon ion induced response. Further assay disclosed that IL-1α but not TNF-α was largely responsible for the activation of macrophages and the formation of micronucleus in BEAS-2B cells. These data suggest that macrophages could transfer secondary bystander signals and play a key role in the secondary bystander effect of photon irradiation, while carbon ion irradiation has conspicuous advantage due to its reduced secondary injury. Copyright © 2015 Elsevier Ireland Ltd. All rights reserved.

Compact time-zero detector for heavy ions

International Nuclear Information System (INIS)

Weissenberger, E.; Kast, W.; Goennenwein, F.

1979-01-01

A time-zero detector for flight-time measurements with heavy ions is described. The ions traverse a thin foil and the secondary electrons splashed from the foil are detected in a channel plate multiplier. A timing signal is derived from the multiplier pulse. The novel features of the detector are its simplicity and compactness of design. The time resolution achieved for the full energy and mass span of fission fragments from the spontaneous fission of 252 Cf used as a heavy ion source is 115 ps (fwhm). (Auth.)

Ion surface collisions on surfaces relevant for fusion devices

International Nuclear Information System (INIS)

Rasul, B.; Endstrasser, N.; Zappa, F.; Grill, V.; Scheier, P.; Mark, T.

2006-01-01

Full text: One of the great challenges of fusion research is the compatibility of reactor grade plasmas with plasma facing materials coating the inner walls of a fusion reactor. The question of which surface coating should be used is of particular interest for the design of ITER. The impact of energetic plasma particles leads to sputtering of wall material into the plasma. A possible solution for the coating of plasma facing walls would be the use of special carbon surfaces. Investigations of these various surfaces have been started at BESTOF ion-surface collision apparatus. Experiment beam of singly charged molecular ions of hydrocarbon molecules, i.e. C 2 H + 4 , is generated in a Nier-type electron impact ionization source at an electron energy of about 70 eV. In the first double focusing mass spectrometer the ions are mass and energy analyzed and afterwards refocused onto a surface. The secondary reaction products are monitored using a Time Of Flight mass spectrometer. The secondary ion mass spectra are recorded as a function of the collision energy for different projectile ions and different surfaces. A comparison of these spectra show for example distinct changes in the survival probability of the same projectile ion C 2 H + 4 for different surfaces. (author)

Modeling Secondary Neutral Helium in the Heliosphere

International Nuclear Information System (INIS)

Müller, Hans-Reinhard; Möbius, Eberhard; Wood, Brian E.

2016-01-01

An accurate, analytic heliospheric neutral test-particle code for helium atoms from the interstellar medium (ISM) is coupled to global heliospheric models dominated by hydrogen and protons from the solar wind and the ISM. This coupling enables the forward-calculation of secondary helium neutrals from first principles. Secondaries are produced predominantly in the outer heliosheath, upwind of the heliopause, by charge exchange of helium ions with neutral atoms. The forward model integrates the secondary production terms along neutral trajectories and calculates the combined neutral helium phase space density in the innermost heliosphere where it can be related to in-situ observations. The phase space density of the secondary component is lower than that of primary neutral helium, but its presence can change the analysis of primaries and the ISM, and can yield valuable insight into the characteristics of the plasma in the outer heliosheath. (paper)

'Applications of stable isotopes in life sciences'. Lead and strontium stable isotope measurements by using a high lateral resolution secondary ion mass spectrometer (NanoSIMS)

International Nuclear Information System (INIS)

Sano, Yuji

2008-01-01

The method of Pb and Sr isotope measurements at about 5 μm resolution was developed by using a high lateral resolution secondary ion mass spectrometer (NanoSIMS NS50). Since the both elements have radiogenic nuclides such as 206 Pb, 207 Pb, and 87 Sr, natural variations of isotopic ratios are large. It is possible to detect a meaningful variation in a terrestrial sample, even though the experimental error is relatively large. In the case of monazite U-Pb dating, a 4 nA O - primary beam was used to sputter the sample and secondary positive ions were extracted for mass analysis using a Mattauch-Herzog geometry. The multi-collector system was modified to detect 140 Ce + , 204 Pb + , 206 Pb + , 238 U 16 O + , and 238 U 16 O 2 + ions simultaneously. Based on the monazite standard from North-Central Madagascar, we have determined the 206 Pb/ 238 U ratios of samples. 207 Pb/ 206 Pb ratios were measured by a magnet scanning with a single collector mode. 44 monazite grains extracted from a sedimentary rock in Taiwan were analyzed. Observed ages were consistent with the U-Th-Pb chemical ages by EPMA. Then NanoSIMS has been used to measure 87 Sr/ 86 Sr ratios in natural calcium carbonate samples. Multi-collector system was adjusted to detect 43 Ca + , 80 Ca 2 + , 86 Sr + , and 87 Sr + ions at the same time. Magnetic field was scanning for the EM no.4 counter to detect 85 Rb + , 86 Sr + and 87 Sr + , while the EM no.4b can measure 86 Sr + , 87 Sr + , and 88 Sr + , respectively. Repeated analyses of a coral skeleton standard (JCp-1) show that 87 Sr/ 86 Sr ratio agrees well with the seawater signature, after the series of corrections such as Ca dimer, 87 Rb, and a mass bias estimated by 88 Sr/ 86 Sr ratio. The method is applied to an otolith from ayu (Pleco-glossus altivelis altivelis) collected from the Yodo river, Japan. The spatial variation of 87 Sr/ 86 Sr ratios was consistent with amphidromous migration of the fish, namely, born in the lake and grown in the coastal sea

Mesoporous magnetic secondary nanostructures as versatile adsorbent for efficient scavenging of heavy metals

Science.gov (United States)

Bhattacharya, Kakoli; Parasar, Devaborniny; Mondal, Bholanath; Deb, Pritam

2015-01-01

Porous magnetic secondary nanostructures exhibit high surface area because of the presence of plentiful interparticle spaces or pores. Mesoporous Fe3O4 secondary nanostructures (MFSNs) have been studied here as versatile adsorbent for heavy metal scavenging. The porosity combined with magnetic functionality of the secondary nanostructures has facilitated efficient heavy metal (As, Cu and Cd) remediation from water solution within a short period of contact time. It is because of the larger surface area of MFSNs due to the porous network in addition to primary nanostructures which provides abundant adsorption sites facilitating high adsorption of the heavy metal ions. The brilliance of adsorption property of MFSNs has been realized through comprehensive adsorption studies and detailed kinetics. Due to their larger dimension, MFSNs help in overcoming the Brownian motion which facilitates easy separation of the metal ion sorbed secondary nanostructures and also do not get drained out during filtration, thus providing pure water. PMID:26602613

Elastic scattering and total reaction cross section for the 6He +58Ni system

Science.gov (United States)

Morcelle, V.; Lichtenthäler, R.; Lépine-Szily, A.; Guimarães, V.; Mendes, D. R., Jr.; Pires, K. C. C.; de Faria, P. N.; Barioni, A.; Gasques, L.; Morais, M. C.; Shorto, J. M. B.; Zamora, J. C.; Scarduelli, V.; Condori, R. Pampa; Leistenschneider, E.

2014-11-01

Elastic scattering measurements of 6He + 58Ni system have been performed at the laboratory energy of 21.7 MeV. The 6He secondary beam was produced by a transfer reaction 9Be (7Li , 6He ) and impinged on 58Ni and 197Au targets, using the Radioactive Ion Beam (RIB) facility, RIBRAS, installed in the Pelletron Laboratory of the Institute of Physics of the University of São Paulo, Brazil. The elastic angular distribution was obtained in the angular range from 15° to 80° in the center of mass frame. Optical model calculations have been performed using a hybrid potential to fit the experimental data. The total reaction cross section was derived.

Evaporative cooling of highly charged ions in EBIT [Electron Beam Ion Trap]: An experimental realization

International Nuclear Information System (INIS)

Schneider, M.B.; Levine, M.A.; Bennett, C.L.; Henderson, J.R.; Knapp, D.A.; Marrs, R.E.

1988-01-01

Both the total number and trapping lifetime of near-neon-like gold ions held in an electron beam ion trap have been greatly increased by a process of 'evaporative cooling'. A continuous flow of low-charge-state ions into the trap cools the high-charge-state ions in the trap. Preliminary experimental results using titanium ions as a coolant are presented. 8 refs., 6 figs., 2 tabs

SIS: an accelerator installation for heavy ions of high energy

International Nuclear Information System (INIS)

The two major sections of the report cover the scientific experimental program and the accelerator installation. Topics covered in the first include: heavy ion physics in the medium energy region; nuclear physics at relativistic energies; atomic physics loss and capture cross sections for electrons; spectroscopy of few-electron systems; atomic collision processes; biological experiments; nuclear track techniques in biology; and experiments with protons and secondary radiation. The second includes: concept for the total installation; technical description of the SIS 12; technical description of the SIS 100; status of the UNILAC injector; development options for the SIS installations; properties of the heavy ion beam; and structural work and technical supply provisions. In this SIS project proposal, an accelerator installation based on two synchrotrons is described with which atomic nuclei up to uranium can be accelerated to energies of more than 10 GeV/μ. With the SIS 12, which is the name of the first stage, heavy ion physics at intermediate energies can be pursued up to 500 MeV/μ. The second stage, a larger synchrotron, the SIS 100, has a diameter of 250 m. With this device, it is proposed to open up the domain of relativistic heavy ion physics up to 14 GeV/μ (for intermediate mass particles) and 10 GeV/μ (for uranium)

Field Observation of the Green Ocean Amazon. Neutral Cluster Air Ion Spectrometer (NAIS) Final Campaign Summary

Energy Technology Data Exchange (ETDEWEB)

Petaja, T. [Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Backman, J. [Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Manninen, H. E. [Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Wimmer, D. [Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

2016-03-01

The neutral cluster and air ion spectrometer (NAIS) was deployed to the T3 site for Intensive Operations Periods 1 and 2 (IOP1 and IOP2). The NAIS is an instrument that measures aerosol particle and ion number size distributions in the mobility diameter range of 0.8 to 42 nm, corresponding to electrical mobility range between 3.2 and 0.0013 cm² V^-1 s^-1. New particle formation (NPF) events were detected using the NAIS at the T3 field site during IOP1 and IOP2. Secondary NPF is a globally important source of aerosol number. To fully explain atmospheric NPF and subsequent growth, we need to directly measure the initial steps of the formation processes in different environments, including rain forest. Particle formation characteristics, such as formation and growth rates, were used as indicators of the relevant processes and participating compounds in the initial formation. In a case of parallel ion and neutral cluster measurements, we estimated the relative contribution of ion-induced and neutral nucleation to the total particle formation.

Structural and compositional characterization of LiNbO{sub 3} crystals implanted with high energy iron ions

Energy Technology Data Exchange (ETDEWEB)

Sada, C., E-mail: cinzia.sada@unipd.i [Universita di Padova and CNISM, Dipartimento di Fisica, Via Marzolo 8, 35131 Padova (Italy); Argiolas, N.; Bazzan, M.; Ciampolillo, M.V.; Zaltron, A.M.; Mazzoldi, P. [Universita di Padova and CNISM, Dipartimento di Fisica, Via Marzolo 8, 35131 Padova (Italy); Agarwal, D.C.; Avastshi, D.K. [Inter-University Accelerator Centre, Post Box-10502, New Delhi 110067 (India)

2010-10-01

Iron ions were implanted with a total fluence of 6 x 10{sup 17} ions/m{sup 2} into lithium niobate crystals by way of a sequential implantation at different energies of 95, 100 and 105 MeV respectively through an energy retarder Fe foil to get a uniform Fe doping of about few microns from the surface. The implanted crystals were then annealed in air in the range 200-400 {sup o}C for different durations to promote the crystalline quality that was damaged by implantation. In order to understand the basic phenomena underlying the implantation process, compositional in-depth profiles obtained by the secondary ion mass spectrometry were correlated to the structural properties of the implanted region measured by the high resolution X-ray diffraction depending on the process parameters. The optimised preparation conditions are outlined in order to recover the crystalline quality, essential for integrated photorefractive applications.

Decontamination and dismantlement of the building 594 waste ion exchange facility at Argonne National Laboratory-East project final report

International Nuclear Information System (INIS)

Wiese, E. C.

1998-01-01

The Building 594 D and D Project was directed toward the following goals: Removal of any radioactive and hazardous materials associated with the Waste Ion Exchange Facility; Decontamination of the Waste Ion Exchange Facility to unrestricted use levels; Demolition of Building 594; and Documentation of all project activities affecting quality (i.e., waste packaging, instrument calibration, audit results, and personnel exposure) These goals had been set in order to eliminate the radiological and hazardous safety concerns inherent in the Waste Ion Exchange Facility and to allow, upon completion of the project, unescorted and unmonitored access to the area. The ion exchange system and the resin contained in the system were the primary areas of concern, while the condition of the building which housed the system was of secondary concern. ANL-E health physics technicians characterized the Building 594 Waste Ion Exchange Facility in September 1996. The characterization identified a total of three radionuclides present in the Waste Ion Exchange Facility with a total activity of less than 5 microCi (175 kBq). The radionuclides of concern were Co 60 , Cs 137 , and Am 241 . The highest dose rates observed during the project were associated with the resin in the exchange vessels. DOE Order 5480.2A establishes the maximum whole body exposure for occupational workers at 5 rem (50 mSv)/yr; the administrative limit at ANL-E is 1 rem/yr (10 mSv/yr)

Application of secondary ion mass spectrometry for the characterization of commercial high performance materials

International Nuclear Information System (INIS)

Gritsch, M.

2000-09-01

The industry today offers an uncounted number of high performance materials, that have to meet highest standards. Commercial high performance materials, though often sold in large quantities, still require ongoing research and development to keep up to date with increasing needs and decreasing tolerances. Furthermore, a variety of materials is on the market that are not fully understood in their microstructure, in the way they react under application conditions, and in which mechanisms are responsible for their degradation. Secondary Ion Mass Spectrometry (SIMS) is an analytical method that is now in commercial use for over 30 years. Its main advantages are the very high detection sensitivity (down to ppb), the ability to measure all elements with isotopic sensitivity, the ability of gaining laterally resolved images, and the inherent capability of depth-profiling. These features make it an ideal tool for a wide field of applications within advanced material science. The present work gives an introduction into the principles of SIMS and shows the successful application for the characterization of commercially used high performance materials. Finally, a selected collection of my publications in reviewed journals will illustrate the state of the art in applied materials research and development with dynamic SIMS. All publications focus on the application of dynamic SIMS to analytical questions that stem from questions arising during the production and improvement of high-performance materials. (author)

Temperature dependence and the moving species during ion mixing

International Nuclear Information System (INIS)

Xia, W.; Fernandes, M.; Hewett, C.A.; Lau, S.S.; Poker, D.B.; Biersack, J.P.

1988-01-01

In this paper, the authors review the experimental observations of the temperature dependence and the moving species in ion mixing, emphasizing the metal-semiconductor systems. Ion mixing is the combined effect of two components. One component is temperature independent and is primarily due to events in the prompt regime, the other component is temperature dependent and has the characteristics of the associated thermal reactions. The moving species during ion mixing are influenced by collisional effects, either due to secondary recoils, or due to local hot spots, or both. The secondary recoil concept is consistent with experimental observations that the motion of the lighter element in a bilayer sample is enhanced. There is ample evidence that while the a thermal regime is caused by particle-solid interactions, thermodynamical forces are important in deciding the magnitude of mixing. In the thermally activated regime, the ion induced reaction product should be influenced by the heats of formation of various compounds. We also indicate areas where satisfactory explanations are not available at present

Seasonal Variations and Correlation Analysis of Water-Soluble Inorganic Ions in PM2.5 in Wuhan, 2013

Directory of Open Access Journals (Sweden)

Ting Huang

2016-03-01

Full Text Available Daily PM2.5 and water-soluble inorganic ions (NH4+, SO42−, NO3−, Cl−, Ca2+, Na+, K+, Mg2+ were collected at the Hongshan Air Monitoring Station at the China University of Geosciences (Wuhan (30°31′N, 114°23′E, Wuhan, from 1 January to 30 December 2013. A total of 52 effective PM2.5 samples were collected using medium flow membrane filter samplers, and the anionic and cationic ions were determined by ion chromatography and ICP, respectively. The results showed that the average mass concentration of the eight ions was 40.96 µg/m3, which accounted for 62% of the entire mass concentration. In addition, the order of the ion concentrations was SO42− > NO3− > NH4+ > Cl− >K+ > Ca2+ > Na+ > Mg2+. The secondary inorganic species SO42−, NO3− and NH4+ were the major components of water-soluble ions in PM2.5, with a concentration of 92% of the total ions of PM2.5, and the total concentrations of the three ions in the four seasons in descending order as follows: winter, spring, autumn, and summer. NH4+ had a significant correlation with SO42− and NO3−, and the highest correlation coefficients were 0.943 and 0.923 (in winter, while the minimum coefficients were 0.683 and 0.610 (in summer. The main particles were (NH42SO4 and NH4NO3 in PM2.5. The charge of the water-soluble ions was nearly balanced in PM2.5, and the pertinence coefficients of water-soluble anions and cations were more than 0.9. The highest pertinence coefficients were in the spring (0.9887, and the minimum was in summer (0.9459. That is, there were more complicated ions in PM2.5 in the summer. The mean value of NO3−/SO42− was 0.64, indicating that stationary sources of PM2.5 had a greater contribution in Wuhan.

High-Resolution State-Selected Ion-Molecule Reaction Studies Using Pulsed Field Ionization Photoelectron-Secondary Ion Coincidence Method

National Research Council Canada - National Science Library

Qian, X

2003-01-01

We have developed an octopole-quadrupole photoionization apparatus at the Advanced Light Source for absolute integral cross-section measurements of rovibrational-state-selected ion-molecule reactions...

Channeling in helium ion microscopy: Mapping of crystal orientation

Directory of Open Access Journals (Sweden)

Vasilisa Veligura

2012-07-01

Full Text Available Background: The unique surface sensitivity and the high resolution that can be achieved with helium ion microscopy make it a competitive technique for modern materials characterization. As in other techniques that make use of a charged particle beam, channeling through the crystal structure of the bulk of the material can occur.Results: Here, we demonstrate how this bulk phenomenon affects secondary electron images that predominantly contain surface information. In addition, we will show how it can be used to obtain crystallographic information. We will discuss the origin of channeling contrast in secondary electron images, illustrate this with experiments, and develop a simple geometric model to predict channeling maxima.Conclusion: Channeling plays an important role in helium ion microscopy and has to be taken into account when trying to achieve maximum image quality in backscattered helium images as well as secondary electron images. Secondary electron images can be used to extract crystallographic information from bulk samples as well as from thin surface layers, in a straightforward manner.

Study of the secondary electron emission during bombardment of metal targets by positive D{sup +} and D{sub 2}{sup +} ions (1960); Etude de l'emission secondaire d'electrons au cours du bombardement de cibles metalliques par des ions positifs D{sup +} et D{sub 2}{sup +} (1960)

Energy Technology Data Exchange (ETDEWEB)

Leroy, J [Commissariat a l' Energie Atomique, Saclay (France).Centre d' Etudes Nucleaires; Prelec, K [Institut Rudjer Boskovic, Zagreb (Croatia)

1960-07-01

The secondary electron yield {gamma}-bar due to primary positive ions D{sup +} and D{sup +}{sub 2} has been measured in the 70 keV to 300 keV ion energy range. Several metallic targets have been used. The variation of this yield with the angle of incidence is proportional to sec {theta} where {theta} is the angle between the beam of primary ions and the normal to the target surface. The values {gamma}-bar decrease for increasing energy ions. At a given energy all the targets tried gave approximately the same electron yield. (author) [French] Le facteur d'emission secondaire a ete mesure pour des ions positifs D{sup +} et D{sup +}{sub 2} ayant une energie comprise entre 70 keV et 300 keV, sur differentes cibles metalliques. La variation de ce facteur avec l'angle d'incidence suit une loi de la forme {gamma}{sub 0} sec {theta}, {theta} etant l'angle entre le faisceau et la normale a la cible. Les valeurs de {gamma}-bar trouvees decroissent lorsque l'energie des ions incidents augmente, mais sont assez voisines les unes des autres, a une energie donnee, pour les differentes cibles essayees. (auteur)

Characterization of gate oxynitrides by means of time of flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy. Quantification of nitrogen

International Nuclear Information System (INIS)

Ferrari, S.; Perego, M.; Fanciulli, M.

2002-01-01

We present a methodology for the quantitative estimation of nitrogen in ultrathin oxynitrides by means of time of flight secondary ion mass spectrometry (TOF-SIMS) and x-ray photoelectron spectroscopy (XPS). We consider an innovative approach to TOF-SIMS depth profiling, by elemental distribution of single species as sum of peaks containing such species. This approach is very efficient in overcoming matrix effect arising when quantifying elements were distributed in silicon and silicon oxide. We use XPS to calibrate TOF-SIMS and to obtain quantitative information on nitrogen distribution in oxynitride thin layers. In the method we propose we process TOF-SIMS and XPS data simultaneously to obtain a quantitative depth profile

Heavy ion physics at CERN

International Nuclear Information System (INIS)

Vesztergombi, G.

1991-01-01

A summary of the present status and future plans for heavy ion experiments at CERN-SPS and CERN-LHC accelerators is given. The planned three phases give possibilities to study the properties of the quark-gluon-plasma (QGP). At the present stage the feasibility of high energy ion-ion experiments with their very abundant secondary hadron production, shows that there is a chance to obtain high densities, and to look for the onset of new, collective phenomena. In a second phase, there should be a chance to obtain more conclusive evidence for the onset of quark deconfinement. In the third stage, the average energy densities rise above the deconfinement threshold, so that a study of the properties of QGP should become possible. (G.P.)

Site-specific fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam

International Nuclear Information System (INIS)

Moritani, Kousuke; Mukai, Gen; Hashinokuchi, Michihiro; Mochiji, Kozo

2009-01-01

The secondary ion mass spectrum (SIMS) of a polystyrene thin film was investigated using a size-selected Ar gas cluster ion beam (GCIB). The fragmentation in the SIM spectrum varied by kinetic energy per atom (E atom ); the E atom dependence of the secondary ion intensity of the fragment species of polystyrene can be essentially classified into three types based on the relationship between E atom and the dissociation energy of a specific bonding site in the molecule. These results indicate that adjusting E atom of size-selected GCIB may realize site-specific bond breaking within a molecule. (author)

Secondary ion emission from metal surfaces bombarded by 0.5-10 keV protons and hydrogens

International Nuclear Information System (INIS)

Kitamura, Akira; Yano, Syukuro

1978-01-01

Secondary ion emission coefficients by bombardment of 0.5 - 10 keV protons K 11 and atomic hydrogens K 01 on copper, stainless steel, molybdenum and evaporated gold surfaces have been measured in a moderate vacuum. Results are summarized as follows; 1) There is no significant difference between K 11 and K 01 . 2) Differences in K 11 and K 11 between different samples of the same material and between the sample before baking-out and the same sample after baking-out are of the order of several tens of percent. 3) The incident particle energy E sub(max) at which K 11 and K 01 have the maximum value lies in the keV region, and increases with the target mass. According to the fact that E sub(max) differs substantially from the energy at which the elastic stopping power has the maximum value, a characteristic length l is introduced and calculated to be of the order of hundreds of A; the factor exp (-x/l) represents the degree of contribution of collision at depth x to K 11 or K 01 . (author)

On different experimental behaviour of fast secondary particles produced in 12C interactions at relativistic energies as studied with radiochemistry and in a propane chamber

International Nuclear Information System (INIS)

Kulakov, B.A.; Karachuk, J.; Gelovani, L.K.; Gridnev, T.G.; Sosnin, A.N.; Brandt, R.

1998-01-01

Energetic secondary fragments produced in the interaction of (41-44) GeV 12 C ions with copper exhibit experimentally a broader angular distribution as compared to energetic secondary fragments produced in the interactions at a lower 12 C-energy (15-25) GeV when studied with radiochemical techniques. Such a different experimental behaviour of secondary fragments produced by 12 C ions of the same two energy groups is not observed, when these secondary fragments are investigated with a propane bubble chamber. Separation of secondary particles is described

Kinetic energy and charge distributions of multiply charged ions produced by heavy ions and by synchrotron radiation

International Nuclear Information System (INIS)

Levin, J.C.; Biedermann, C.; Cederquist, H.; Liljeby, L.; Short, R.T.; Sellin, I.A.

1989-01-01

This paper contrasts two methods of production of multiply charged ions which may have application in future hot-atom chemistry experiments. Interest in extending the study of ion-atom collisions from MeV to keV to eV energies has grown rapidly in the last decade as previously inaccessible astrophysical, fusion, and spectroscopic problems have been addressed. One of these methods involves highly charged secondary beams formed from ions created in dilute gas samples irradiated by fast (MeV), high-charge-state, heavy ions. The measurements show, however, that such ions often have mean recoil energies two orders of magnitude higher than kinetic energies of ions in similar charge states resulting from vacancy cascades of atomic inner shells photoionized by synchrotron x rays. These results may be applicable to development of a cold source of highly charged ions featuring low energy spread and good angular definition. Results from other laboratories (Grandin et al at Ganil, Ullrich et al in Frankfurt, and Watson et al at Texas A ampersand M) will also be discussed

Contribution of backscattered electrons to the total electron yield ...

Indian Academy of Sciences (India)

a better fit to the experiment compared to the power-law. Keywords ... is based on many different mechanisms, for example, ion-induced secondary elec- ... modified these theories using a Lindhard power potential formalism to describe SE ..... principle. The constant-loss indicates the importance of straggling of the primaries.

Secondary mechanisms in a gas discharge

International Nuclear Information System (INIS)

Fletcher, J.; Blevin, H.A.

1978-05-01

The technique for studying swarms of electrons in a gas discharge by observing the photon flux from the discharge has been adapted to investigate the role of the secondary mechanisms. First results, reported here, show that, contrary to previous indications, ion bombardment of the cathode plays only a negligible, if any, part in the low pressure discharge in hydrogen at E/N approx. less than 200Td

Empirical evaluation of metal deposition for the analysis of organic compounds with static secondary ion mass spectrometry (S-SIMS)

International Nuclear Information System (INIS)

Mondt, R. de; Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Vaeck, L. van; Gijbels, R.

2006-01-01

Metal-assisted (MetA) SIMS using the deposition of a thin Au or Ag layer on non-conducting samples prior to analysis has been advocated as a means to improve the secondary ion (S.I.) yields of organic analytes. This study focuses on the influence of time and temperature on the yield enhancement in MetA-SIMS using thick layers of poly(vinylbutyral-co-vinylalcohol-co-vinylacetate) (PVB) containing dihydroxybenzophenone (DHBPh) or a cationic carbocyanine dye (CBC) and spin-coated layers of the cationic dye on Si. Pristine samples as well as Au- and Ag-coated ones were kept between -8 deg. C and 80 deg. C and analysed with S-SIMS at intervals of a few days over a period of 1 month. The yield enhancement was found to depend strongly on the kind of evaporated metal, the storage temperature and time between coating and analysis

Statistical Characterization of 18650-Format Lithium-Ion Cell Thermal Runaway Energy Distributions

Science.gov (United States)

Walker, William Q.; Rickman, Steven; Darst, John; Finegan, Donal; Bayles, Gary; Darcy, Eric

2017-01-01

Effective thermal management systems, designed to handle the impacts of thermal runaway (TR) and to prevent cell-to-cell propagation, are key to safe operation of lithium-ion (Li-ion) battery assemblies. Critical factors for optimizing these systems include the total energy released during a single cell TR event and the fraction of the total energy that is released through the cell casing vs. through the ejecta material. A unique calorimeter was utilized to examine the TR behavior of a statistically significant number of 18650-format Li-ion cells with varying manufacturers, chemistries, and capacities. The calorimeter was designed to contain the TR energy in a format conducive to discerning the fractions of energy released through the cell casing vs. through the ejecta material. Other benefits of this calorimeter included the ability to rapidly test of large quantities of cells and the intentional minimization of secondary combustion effects. High energy (270 Wh/kg) and moderate energy (200 Wh/kg) 18650 cells were tested. Some of the cells had an imbedded short circuit (ISC) device installed to aid in the examination of TR mechanisms under more realistic conditions. Other variations included cells with bottom vent (BV) features and cells with thin casings (0.22 1/4m). After combining the data gathered with the calorimeter, a statistical approach was used to examine the probability of certain TR behavior, and the associated energy distributions, as a function of capacity, venting features, cell casing thickness and temperature.

Dietary exposure of Hong Kong secondary school students to total mercury and methylmercury from fish intake.

Science.gov (United States)

Tang, Anna Shiu Ping; Kwong, Ka Ping; Chung, Stephen Wai Cheung; Ho, Yuk Yin; Xiao, Ying

2009-01-01

Fish is the main source of dietary exposure to methylmercury (MeHg), which is a public health concern owing to its potential neurotoxicity. To evaluate the public health risk, this study estimated the total mercury (tHg) and MeHg exposure from fish intake in Hong Kong secondary school students. Median tHg and MeHg concentrations of 280 samples purchased from different commercial outlets (covering 89 species of whole fish and three types of canned tuna), together with the local food consumption data of secondary school students obtained by semi-quantitative food frequency questionnaire in 2000, were used to estimate dietary exposure from fish intake for the average and high consumer (95th percentile exposure). For tHg, the median concentration was 63 µg kg(-1) (range 3-1370 µg kg(-1)) and estimated exposures ranged 0.5-0.6 µg kg(-1) body weight (bw) week(-1) for an average consumer and 1.6-1.9 µg kg(-1) bw week(-1) for a high consumer. For MeHg, median concentration was 48 µg kg(-1) (range 3-1010 µg kg(-1)) and estimated dietary exposures were 0.4-0.5 µg kg(-1) bw week(-1) for an average consumer and 1.2-1.4 µg kg(-1) bw week(-1) for a high consumer. These values are below the respective provisional tolerable weekly intake (PTWI) established by the Joint Food and Agriculture Organization/World Health Organization Expert Committee on Food Additives (JECFA). The health risk is greater for high consumers since MeHg exposures may approach or exceed the PTWI when other dietary sources are taken into account.

Proton and carbon ion radiotherapy for primary brain tumors and tumors of the skull base

Energy Technology Data Exchange (ETDEWEB)

Combs, Stephanie E.; Kessel, Kerstin; Habermehl, Daniel; Debus, Jurgen [Univ. Hospital of Heidelberg, Dept. of Radiation Oncology, Heidelberg (Germany)], e-mail: Stephanie.Combs@med.uni-heidelberg.de; Haberer, Thomas [Heidelberger Ionenstrahl Therapiezentrum (HIT), Heidelberg (Germany); Jaekel, Oliver [Univ. Hospital of Heidelberg, Dept. of Radiation Oncology, Heidelberg (Germany); Heidelberger Ionenstrahl Therapiezentrum (HIT), Heidelberg (Germany)

2013-10-15

To analyze clinical concepts, toxicity and treatment outcome in patients with brain and skull base tumors treated with photons and particle therapy. Material and methods: In total 260 patients with brain tumors and tumors of the skull base were treated at the Heidelberg Ion Therapy Center (HIT). Patients enrolled in and randomized within prospective clinical trials as well as bony or soft tissue tumors are not included in this analysis. Treatment was delivered as protons, carbon ions, or combinations of photons and a carbon ion boost. All patients are included in a tight follow-up program. The median follow-up time is 12 months (range 2-39 months). Results: Main histologies included meningioma (n = 107) for skull base lesions, pituitary adenomas (n = 14), low-grade gliomas (n = 51) as well as high-grade gliomas (n = 55) for brain tumors. In all patients treatment could be completed without any unexpected severe toxicities. No side effects > CTC Grade III were observed. To date, no severe late toxicities were observed, however, for endpoints such as secondary malignancies or neuro cognitive side effects follow-up time still remains too short. Local recurrences were mainly seen in the group of high-grade gliomas or atypical meningiomas; for benign skull base meningiomas, to date, no recurrences were observed during follow-up. Conclusion: The specific benefit of particle therapy will potentially reduce the risk of secondary malignancies as well as improve neuro cognitive outcome and quality of life (QOL); thus, longer follow-up will be necessary to confirm these endpoints. Indication-specific trials on meningiomas and gliomas are underway to elucidate the role of protons and carbon ions in these indications.

Proton and carbon ion radiotherapy for primary brain tumors and tumors of the skull base

International Nuclear Information System (INIS)

Combs, Stephanie E.; Kessel, Kerstin; Habermehl, Daniel; Debus, Jurgen; Haberer, Thomas; Jaekel, Oliver

2013-01-01

To analyze clinical concepts, toxicity and treatment outcome in patients with brain and skull base tumors treated with photons and particle therapy. Material and methods: In total 260 patients with brain tumors and tumors of the skull base were treated at the Heidelberg Ion Therapy Center (HIT). Patients enrolled in and randomized within prospective clinical trials as well as bony or soft tissue tumors are not included in this analysis. Treatment was delivered as protons, carbon ions, or combinations of photons and a carbon ion boost. All patients are included in a tight follow-up program. The median follow-up time is 12 months (range 2-39 months). Results: Main histologies included meningioma (n = 107) for skull base lesions, pituitary adenomas (n = 14), low-grade gliomas (n = 51) as well as high-grade gliomas (n = 55) for brain tumors. In all patients treatment could be completed without any unexpected severe toxicities. No side effects > CTC Grade III were observed. To date, no severe late toxicities were observed, however, for endpoints such as secondary malignancies or neuro cognitive side effects follow-up time still remains too short. Local recurrences were mainly seen in the group of high-grade gliomas or atypical meningiomas; for benign skull base meningiomas, to date, no recurrences were observed during follow-up. Conclusion: The specific benefit of particle therapy will potentially reduce the risk of secondary malignancies as well as improve neuro cognitive outcome and quality of life (QOL); thus, longer follow-up will be necessary to confirm these endpoints. Indication-specific trials on meningiomas and gliomas are underway to elucidate the role of protons and carbon ions in these indications

Short bunch length detector for ion beam with high bunch density

International Nuclear Information System (INIS)

Tron, A.M.; Shako, V.V.

1993-01-01

The secondary electron rf monitors for short ion bunch phase distribution measurements are presented. Construction particularities of the monitors, influence of space charge of both the primary and the secondary electron beams on the phase resolution, thermal regime of the target during beam-target interaction are considered

The role of space charge compensation for ion beam extraction and ion beam transport (invited)

International Nuclear Information System (INIS)

Spädtke, Peter

2014-01-01

Depending on the specific type of ion source, the ion beam is extracted either from an electrode surface or from a plasma. There is always an interface between the (almost) space charge compensated ion source plasma, and the extraction region in which the full space charge is influencing the ion beam itself. After extraction, the ion beam is to be transported towards an accelerating structure in most cases. For lower intensities, this transport can be done without space charge compensation. However, if space charge is not negligible, the positive charge of the ion beam will attract electrons, which will compensate the space charge, at least partially. The final degree of Space Charge Compensation (SCC) will depend on different properties, like the ratio of generation rate of secondary particles and their loss rate, or the fact whether the ion beam is pulsed or continuous. In sections of the beam line, where the ion beam is drifting, a pure electrostatic plasma will develop, whereas in magnetic elements, these space charge compensating electrons become magnetized. The transport section will provide a series of different plasma conditions with different properties. Different measurement tools to investigate the degree of space charge compensation will be described, as well as computational methods for the simulation of ion beams with partial space charge compensation

Ninth international conference on ion beam modification of materials. Book of abstracts

International Nuclear Information System (INIS)

1995-01-01

The conference focused on new developments and current status in the use of ion beams for modification of materials including: fundamental ion beam research and secondary effects of ion beams; materials modifications and techniques; biomedical and industrial applications; low energy processes; point defects and damage, nanocrystals in insulators, plasma immersion ion implantation, molecular dynamics simulations of ion-surface interactions, ion-beam mixing of insulators, GeV ion irradiation, electro-optical materials, polymers, tribological materials, and semiconductor processing. The handbook contains the workshop's program, abstracts and an author index. Separate abstracts were prepared for all papers in this volume

Ninth international conference on ion beam modification of materials. Book of abstracts

Energy Technology Data Exchange (ETDEWEB)

NONE

1995-12-31

The conference focused on new developments and current status in the use of ion beams for modification of materials including: fundamental ion beam research and secondary effects of ion beams; materials modifications and techniques; biomedical and industrial applications; low energy processes; point defects and damage, nanocrystals in insulators, plasma immersion ion implantation, molecular dynamics simulations of ion-surface interactions, ion-beam mixing of insulators, GeV ion irradiation, electro-optical materials, polymers, tribological materials, and semiconductor processing. The handbook contains the workshop`s program, abstracts and an author index. Separate abstracts were prepared for all papers in this volume.

Imaging and characterization of primary and secondary radiation in ion beam therapy

Energy Technology Data Exchange (ETDEWEB)

Granja, Carlos, E-mail: carlos.granja@utef.cvut.cz; Opalka, Lukas [Institute of Experimental and Applied Physics, Czech Technical University in Prague (Czech Republic); Martisikova, Maria; Gwosch, Klaus [German Cancer Research Center, Heidelberg (Germany); Jakubek, Jan [Advacam, Prague (Czech Republic)

2016-07-07

Imaging in ion beam therapy is an essential and increasingly significant tool for treatment planning and radiation and dose deposition verification. Efforts aim at providing precise radiation field characterization and online monitoring of radiation dose distribution. A review is given of the research and methodology of quantum-imaging, composition, spectral and directional characterization of the mixed-radiation fields in proton and light ion beam therapy developed by the IEAP CTU Prague and HIT Heidelberg group. Results include non-invasive imaging of dose deposition and primary beam online monitoring.

Imaging and characterization of primary and secondary radiation in ion beam therapy

International Nuclear Information System (INIS)

Granja, Carlos; Opalka, Lukas; Martisikova, Maria; Gwosch, Klaus; Jakubek, Jan

2016-01-01

Imaging in ion beam therapy is an essential and increasingly significant tool for treatment planning and radiation and dose deposition verification. Efforts aim at providing precise radiation field characterization and online monitoring of radiation dose distribution. A review is given of the research and methodology of quantum-imaging, composition, spectral and directional characterization of the mixed-radiation fields in proton and light ion beam therapy developed by the IEAP CTU Prague and HIT Heidelberg group. Results include non-invasive imaging of dose deposition and primary beam online monitoring.

Response of CR39 detector to 5 A GeV Si14+ ions and measurement of total charge changing cross-section

International Nuclear Information System (INIS)

Gupta, Renu; Kumar, Ashavani

2013-01-01

In the present work, response of CR39 track etch detector was obtained by cone-height measurement technique. CR39 track etch detector was used to identify the incident charged particles and their fragments by the measurements of cone-height of tracks using an optical microscope DM6000 M and automated image analyzer system installed with Leica QWin Plus software. The CR39 detector was calibrated and the response points were fitted with a linear relation and all the points are within the limits of the experimental errors. The charge resolution of the detector was calculated to be 0.2e. The response function is obtained and fitted with a linear relation which is good throughout Z/β=6.1–14.1. The experimental value of the total charge changing cross-section of 5 A GeV Si 14+ ion beam in polyethylene and CR39 combined target is σ tot =(734±128) mb. The total charge changing cross-section is compared with the experimental results of others based on cone base-area measurement technique and also fitted by the Bradt–Peters geometrical cross-section. - Highlights: • Charge resolution of 0.2e was obtained by cone-height measurement. • Consistency in manual measurements of cone-heights is presented. • Response of CR39 detector was obtained and fitted with first degree polynomial. • Total charge changing cross-section of 5 A GeV Si 14+ ions in CH 2 and CR39 as a combined target was calculated

The Stanford-U.S. Geological Survey SHRIMP ion microprobe--a tool for micro-scale chemical and isotopic analysis

Science.gov (United States)

Bacon, Charles R.; Grove, Marty; Vazquez, Jorge A.; Coble, Matthew A.

2012-01-01

Answers to many questions in Earth science require chemical analysis of minute volumes of minerals, volcanic glass, or biological materials. Secondary Ion Mass Spectrometry (SIMS) is an extremely sensitive analytical method in which a 5–30 micrometer diameter "primary" beam of charged particles (ions) is focused on a region of a solid specimen to sputter secondary ions from 1–5 nanograms of the sample under high vacuum. The elemental abundances and isotopic ratios of these secondary ions are determined with a mass spectrometer. These results can be used for geochronology to determine the age of a region within a crystal thousands to billions of years old or to precisely measure trace abundances of chemical elements at concentrations as low as parts per billion. A partnership of the U.S. Geological Survey and the Stanford University School of Earth Sciences operates a large SIMS instrument, the Sensitive High-Resolution Ion Microprobe with Reverse Geometry (SHRIMP–RG) on the Stanford campus.

Spontaneous radiation emission during penetration of ions in solids

International Nuclear Information System (INIS)

Miraglia, J.E.; Pacher, M.C.

1988-01-01

In this work, the principal continuum radiative emission processes, which occur during the penetration of ions in solids or gases, are resumed. The characteristics of the following processes are discussed: secondary electron bremsstrahlung (SEB), atomic bremsstrahlung (AB), and internuclear bremsstrahlung (INB). Recent advances of the ion channeling effects in crystal solids on the spontaneous radiative spectra are exposed. (A.C.A.S.) [pt

Design of the radioactive ion beam facility at the LNS

International Nuclear Information System (INIS)

Migneco, E.; Alba, R.; Calabretta, L.; Ciavola, G.; Cuttone, G.; Di Giacomo, M.; Gammino, S.; Gmaj, P.; Moscatello, M.H.; Raia, G.

1992-01-01

At the Laboratorio Nazionale del Sud the existing 15 MV Tandem will be coupled to the Superconducting Cyclotron booster, which will provide light and heavy ion beams in the energy range 100-20 MeV/n. Using these beams, secondary radioactive beams can be produced by projectile fragmentation. A fragment separator will collect the secondary beam produced at energies near that of the projectile and deliver it into the experimental areas. The possibility of using an ECRIS source for the axial injection into the Cyclotron and producing radioactive ions on a thick source placed inside the Tandem preinjector is also discussed. (author) 7 refs.; 2 figs.; 1 tab

PHEV/EV Li-Ion Battery Second-Use Project (Presentation)

Energy Technology Data Exchange (ETDEWEB)

Neubauer, J.; Pesaran, A.

2010-04-01

Accelerated development and market penetration of plug-in hybrid electric vehicles (PHEVs) and electric vehicles (Evs) are restricted at present by the high cost of lithium-ion (Li-ion) batteries. One way to address this problem is to recover a fraction of the battery cost via reuse in other applications after the battery is retired from service in the vehicle, if the battery can still meet the performance requirements of other energy storage applications. In several current and emerging applications, the secondary use of PHEV and EV batteries may be beneficial; these applications range from utility peak load reduction to home energy storage appliances. However, neither the full scope of possible opportunities nor the feasibility or profitability of secondary use battery opportunities have been quantified. Therefore, with support from the Energy Storage activity of the U.S. Department of Energy's Vehicle Technologies Program, the National Renewable Energy Laboratory (NREL) is addressing this issue. NREL will bring to bear its expertise and capabilities in energy storage for transportation and in distributed grids, advanced vehicles, utilities, solar energy, wind energy, and grid interfaces as well as its understanding of stakeholder dynamics. This presentation introduces NREL's PHEV/EV Li-ion Battery Secondary-Use project.

Triple-membrane reduces need for ion exchange regeneration

International Nuclear Information System (INIS)

Valcour, H.

1989-01-01

Triple-membrane water treatment systems are comprised of ultrafiltration units for pretreatment, electrodialysis reversal primary demineralizers, reverse osmosis secondary demineralizers, portable ion exchange unit polishing demineralizers, and ultraviolet sterilizers. The triple-membrane process is designed to provide an unprecedented degree of pretreatment to maximize efficiency, durability and reliability of the reverse osmosis, whilst reducing the required regeneration frequency of the ion exchange demineralizer by one to two orders of magnitude. (author)

Ion Acceleration by Double Layers with Multi-Component Ion Species

Science.gov (United States)

Good, Timothy; Aguirre, Evan; Scime, Earl; West Virginia University Team

2017-10-01

Current-free double layers (CFDL) models have been proposed to explain observations of magnetic field-aligned ion acceleration in plasmas expanding into divergent magnetic field regions. More recently, experimental studies of the Bohm sheath criterion in multiple ion species plasma reveal an equilibration of Bohm speeds at the sheath-presheath boundary for a grounded plate in a multipole-confined filament discharge. We aim to test this ion velocity effect for CFDL acceleration. We report high resolution ion velocity distribution function (IVDF) measurements using laser induced fluorescence downstream of a CFDL in a helicon plasma. Combinations of argon-helium, argon-krypton, and argon-xenon gases are ionized and measurements of argon or xenon IVDFs are investigated to determine whether ion acceleration is enhanced (or diminished) by the presence of lighter (or heavier) ions in the mix. We find that the predominant effect is a reduction of ion acceleration consistent with increased drag arising from increased gas pressure under all conditions, including constant total gas pressure, equal plasma densities of different ions, and very different plasma densities of different ions. These results suggest that the physics responsible for acceleration of multiple ion species in simple sheaths is not responsible for the ion acceleration observed in these expanding plasmas. Department of Physics, Gettysburg College.

Rapid thermal and swift heavy ion induced annealing of Co ion implanted GaN films

International Nuclear Information System (INIS)

Baranwal, V.; Pandey, A. C.; Gerlach, J. W.; Rauschenbach, B.; Karl, H.; Kanjilal, D.; Avasthi, D. K.

2008-01-01

Thin epitaxial GaN films grown on 6H-SiC(0001) substrates were implanted with 180 keV Co ions at three different fluences. As-implanted samples were characterized with secondary ion mass spectrometry and Rutherford backscattering spectrometry to obtain the Co depth profiles and the maximum Co concentrations. As-implanted samples were annealed applying two different techniques: rapid thermal annealing and annealing by swift heavy ion irradiation. Rapid thermal annealing was done at two temperatures: 1150 deg. C for 20 s and 700 deg. C for 5 min. 200 MeV Ag ions at two fluences were used for annealing by irradiation. Crystalline structure of the pristine, as-implanted, and annealed samples was investigated using x-ray diffraction, and the results were compared. Improvement of the crystalline quality was observed for rapid thermal annealed samples at the higher annealing temperature as confirmed with rocking curve measurements. The results indicate the presence of Co clusters in these annealed samples. Swift heavy ion irradiation with the parameters chosen for this study did not lead to a significant annealing

Heavy ion beam probe development for the plasma potential measurement on the TUMAN-3M tokamak

International Nuclear Information System (INIS)

Askinazi, L.G.; Kornev, V.A.; Lebedev, S.V.; Tukachinsky, A.S.; Zhubr, N.A.; Dreval, N.B.; Krupnik, L.I.

2004-01-01

The peculiarities of the heavy ion beam probe implementation on the small aspect ratio tokamak TUMAN-3M are analyzed. The toroidal displacement of beam trajectory due to the high I pl /B tor ratio is taken into account when designing the layout of the diagnostic. Numerical calculation of beam trajectories using realistic configuration of TUMAN-3M magnetic fields and parabolic plasma current profile resulted in proper adjustment of probing and detection parameters (probing ion material, energy, entrance angles, detector location, and orientation). Secondary ion energy analyzer gain functions G and F were measured in situ using neutral hydrogen puffed in the tokamak vessel as a target for secondary ions production. The detector unit featured split-plate design and had additional electrodes for secondary electron emission suppression. As a result, the diagnostic is now capable of plasma potential evolution measurement and is sensitive enough to trace the potential profile evolution at the L-H mode transition

Environmental impact assessment and end-of-life treatment policy analysis for Li-ion batteries and Ni-MH batteries.

Science.gov (United States)

Yu, Yajuan; Chen, Bo; Huang, Kai; Wang, Xiang; Wang, Dong

2014-03-18

Based on Life Cycle Assessment (LCA) and Eco-indicator 99 method, a LCA model was applied to conduct environmental impact and end-of-life treatment policy analysis for secondary batteries. This model evaluated the cycle, recycle and waste treatment stages of secondary batteries. Nickel-Metal Hydride (Ni-MH) batteries and Lithium ion (Li-ion) batteries were chosen as the typical secondary batteries in this study. Through this research, the following results were found: (1) A basic number of cycles should be defined. A minimum cycle number of 200 would result in an obvious decline of environmental loads for both battery types. Batteries with high energy density and long life expectancy have small environmental loads. Products and technology that help increase energy density and life expectancy should be encouraged. (2) Secondary batteries should be sorted out from municipal garbage. Meanwhile, different types of discarded batteries should be treated separately under policies and regulations. (3) The incineration rate has obvious impact on the Eco-indicator points of Nickel-Metal Hydride (Ni-MH) batteries. The influence of recycle rate on Lithium ion (Li-ion) batteries is more obvious. These findings indicate that recycling is the most promising direction for reducing secondary batteries' environmental loads. The model proposed here can be used to evaluate environmental loads of other secondary batteries and it can be useful for proposing policies and countermeasures to reduce the environmental impact of secondary batteries.

Environmental Impact Assessment and End-of-Life Treatment Policy Analysis for Li-Ion Batteries and Ni-MH Batteries

Directory of Open Access Journals (Sweden)

Yajuan Yu

2014-03-01

Full Text Available Based on Life Cycle Assessment (LCA and Eco-indicator 99 method, a LCA model was applied to conduct environmental impact and end-of-life treatment policy analysis for secondary batteries. This model evaluated the cycle, recycle and waste treatment stages of secondary batteries. Nickel-Metal Hydride (Ni-MH batteries and Lithium ion (Li-ion batteries were chosen as the typical secondary batteries in this study. Through this research, the following results were found: (1 A basic number of cycles should be defined. A minimum cycle number of 200 would result in an obvious decline of environmental loads for both battery types. Batteries with high energy density and long life expectancy have small environmental loads. Products and technology that help increase energy density and life expectancy should be encouraged. (2 Secondary batteries should be sorted out from municipal garbage. Meanwhile, different types of discarded batteries should be treated separately under policies and regulations. (3 The incineration rate has obvious impact on the Eco-indicator points of Nickel-Metal Hydride (Ni-MH batteries. The influence of recycle rate on Lithium ion (Li-ion batteries is more obvious. These findings indicate that recycling is the most promising direction for reducing secondary batteries’ environmental loads. The model proposed here can be used to evaluate environmental loads of other secondary batteries and it can be useful for proposing policies and countermeasures to reduce the environmental impact of secondary batteries.

Environmental Impact Assessment and End-of-Life Treatment Policy Analysis for Li-Ion Batteries and Ni-MH Batteries

Science.gov (United States)

Yu, Yajuan; Chen, Bo; Huang, Kai; Wang, Xiang; Wang, Dong

2014-01-01

Based on Life Cycle Assessment (LCA) and Eco-indicator 99 method, a LCA model was applied to conduct environmental impact and end-of-life treatment policy analysis for secondary batteries. This model evaluated the cycle, recycle and waste treatment stages of secondary batteries. Nickel-Metal Hydride (Ni-MH) batteries and Lithium ion (Li-ion) batteries were chosen as the typical secondary batteries in this study. Through this research, the following results were found: (1) A basic number of cycles should be defined. A minimum cycle number of 200 would result in an obvious decline of environmental loads for both battery types. Batteries with high energy density and long life expectancy have small environmental loads. Products and technology that help increase energy density and life expectancy should be encouraged. (2) Secondary batteries should be sorted out from municipal garbage. Meanwhile, different types of discarded batteries should be treated separately under policies and regulations. (3) The incineration rate has obvious impact on the Eco-indicator points of Nickel-Metal Hydride (Ni-MH) batteries. The influence of recycle rate on Lithium ion (Li-ion) batteries is more obvious. These findings indicate that recycling is the most promising direction for reducing secondary batteries’ environmental loads. The model proposed here can be used to evaluate environmental loads of other secondary batteries and it can be useful for proposing policies and countermeasures to reduce the environmental impact of secondary batteries. PMID:24646862

Secondary influences and ectopic causes of canine hip dysplasia. Critical constructive thoughts to hip dysplasia diagnostics and to current breeding strategies

International Nuclear Information System (INIS)

Schawalder, P.; Spreng, D.; Dietschi, E.; Dolf, G.; Gaillard, C.

1996-01-01

This article questions the stagnation of breeding results by hip dysplasia screening and its current etiology. The ''Coxa Valga Antetorta'', anteversion of the hip joint and ''soft tissue displasia'' are discussed besides a multitude of primary diseases leading to growth deformities and other diseases in the hip. Ectopic primary causes like malformation of the spine leading to a secondary ''dysplatic'' osteoarthritis of the hip (functional secondary dysplasia) are also discussed in this article. Recent and very promising breeding strategies (estimation of the breeding value) in the battle against hip dysplasia are presented. Biochemical, immunological and structural aspects are presented as a not totally utopic perspecitive. Molecular genetic markers for hip dysplasia will offer in the near future a possibility to detect carriers ct the disease by a blood sample ion before clinical manifestation

Double-differential heavy-ion production cross sections

International Nuclear Information System (INIS)

Miller, T. M.; Townsend, L. W.

2004-01-01

Current computational tools used for space or accelerator shielding studies transport energetic heavy ions either using a one-dimensional straight-ahead approximation or by dissociating the nuclei into protons and neutrons and then performing neutron and proton transport using Monte Carlo techniques. Although the heavy secondary particles generally travel close to the beam direction, a proper treatment of the light ions produced in these reactions requires that double-differential cross sections should be utilised. Unfortunately, no fundamental nuclear model capable of serving as an event generator to provide these cross sections for all ions and energies of interest exists currently. Herein, we present a model for producing double-differential heavy-ion production cross sections that uses heavy-ion fragmentation yields produced by the NUCFRG2 fragmentation code coupled with a model of energy degradation in nucleus-nucleus collisions and systematics of momentum distributions to provide energy and angular dependences of the heavy-ion production. (authors)

Gas discharge ion source. I. Duoplasmatron

International Nuclear Information System (INIS)

Bacon, F.M.

1978-01-01

The effects of the plasma expansion cup on the operation of a duoplasmatron ion source have been investigated by measuring the total ion current and the distributions of the ion energy, mass, and current density. A copper expansion cup did not affect the magnetic field near the anode of the ion source and consequently the ion current density distribution was sharply peaked near the center of the cup. Ion energy distributions were approximately symmetrical about anode potential. The dominant ionic species were D + 3 and D + at low and high arc currents, respectively. Changes in the electrical potential of the copper cup with respect to the anode produced negligible changes in the above data. A mild steel plasma expansion cup caused the magnetic field to diverge and intercept the cup walls, resulting in ion current density distributions that were flatter and more amenable to focusing than the ones with the copper cup. With the steel cup at anode potential, the ion mass distribution was similar to that from the copper cup; however, the ion energy distribution was asymmetrical about the anode potential with a peak about 10-20 V above anode potential. The total ion current from this mode of operation was about one-third the value from the copper cup. If the steel cup assumed floating potential, about 50 V below anode potential, the total current increased to the level observed from the copper cup and the ion energy distribution was similar to that observed with the copper cup but the current density distribution was much flatter than that of the copper cup. The ion mass distribution was 60%-70% atomic ions over the entire arc current range investigated. Based on these data, a modified plasma expansion cup was designed with tapered steel walls lined with a boron nitride insert. The overall performance of the duoplasmatron ion source with this cup was superior to any of the previous three modes of operation

Risk factors and clinical course of hungry bone syndrome after total parathyroidectomy in dialysis patients with secondary hyperparathyroidism.

Science.gov (United States)

Ho, Lo-Yi; Wong, Ping-Nam; Sin, Ho-Kwan; Wong, Yuk-Yi; Lo, Kwok-Chi; Chan, Shuk-Fan; Lo, Man-Wai; Lo, Kin-Yee; Mak, Siu-Ka; Wong, Andrew Kui-Man

2017-01-10

Hungry bone syndrome (HBS) is an important postoperative complication after parathyroidectomy for severe secondary hyperparathyroidism (SHPT). There is, however, little data in the literature on its detailed clinical course, and the associated risk factors remain controversial. We did a single-center retrospective study on 62 consecutive dialysis patients who underwent total parathyroidectomy for SHPT to examine the risk factors, clinical course and outcome. Data on demographic characteristics, perioperative laboratory parameters including serum calcium, phosphate, alkaline phosphatase (ALP) and parathyroid hormone (PTH), drug treatment for SHPT and operative details of parathyroidectomy were collected. Seventeen (27.4%) patients developed severe postoperative hypocalcemia with HBS. The serum calcium dropped progressively while serum ALP rose after operation until 2 weeks later when serum calcium reached the trough and serum ALP peaked. Serum phosphate also fell but stabilized between 4 and 14 days. The total postoperative calcium and vitamin D supplementation was significantly larger, and hospital stay was significantly longer in the group with HBS as compared with those without HBS. Young age, high body weight, high preoperative ALP level, and low preoperative calcium level independently predicted the development of HBS while preoperative PTH and use of cinacalcet or paricalcitol did not. HBS was common after total parathyroidectomy in patients with SHPT, and it is important to closely monitor the postoperative serum calcium, phosphate and ALP levels in the following 2 weeks, especially for those at risk. The implications of our findings on perioperative management are discussed.

Low-altitude ion heating with downflowing and upflowing ions

Science.gov (United States)

Shen, Y.; Knudsen, D. J.; Burchill, J. K.; Howarth, A. D.; Yau, A. W.; James, G.; Miles, D.; Cogger, L. L.; Perry, G. W.

2017-12-01

Mechanisms that energize ions at the initial stage of ion upflow are still not well understood. We statistically investigate ionospheric ion energization and field-aligned motion at very low altitudes (330-730 km) using simultaneous plasma, magnetic field, wave electric field and optical data from the e-POP satellite. The high-time-resolution (10 ms) dataset enables us to study the micro-structures of ion heating and field-aligned ion motion. The ion temperature and field-aligned bulk flow velocity are derived from 2-D ion distribution functions measured by the SEI instrument. From March 2015 to March 2016, we've found 17 orbits (in total 24 ion heating periods) with clear ion heating signatures passing across the dayside cleft or the nightside auroral regions. Most of these events have consistent ion heating and flow velocity characteristics observed from both the SEI and IRM instruments. The perpendicular ion temperature goes up to 4.5 eV within a 2 km-wide region in some cases, in which the Radio Receiver Instrument (RRI) sees broadband extremely low frequency (BBELF) waves, demonstrating significant wave-ion heating down to as low as 350 km. The e-POP Fast Auroral Imager (FAI) and Magnetic Field (MGF) instruments show that many events are associated with active aurora and are within downward current regions. Contrary to what would be expected from mirror-force acceleration of heated ions, the majority of these heating events (17 out of 24) are associated with the core ion downflow rather than upflow. These statistical results provide us with new sights into ion heating and field-aligned flow processes at very low altitudes.