X-ray diffraction on nanoparticles chromium and nickel oxides obtained by gelatin using synchrotron radiation

International Nuclear Information System (INIS)

Menezes, Alan Silva de; Medeiros, Angela Maria de Lemos; Miranda, Marcus Aurelio Ribeiro; Almeida, Juliana Marcela Abraao; Remedios, Claudio Marcio Rocha; Silva, Lindomar R.D. da; Gouveia, S.T.; Sasaki, Jose Marcos; Jardim, P.M.

2003-01-01

Full text: Cr 2 O 3 nanoparticles has many applications like green pigments, wear resistance, and coating materials for thermal protection. Several methods to produce chromium oxide nanoparticles have already been studied, gas condensation, laser induced pyrolysis, microwave plasma, sol-gel and gamma radiation methods. Many applications for this kind of material can be provide concerning the particle size. For instance, particle size approximately of 200 nm are preferable as pigment due to its opacity and below 50 nm can be used as transparent pigment. In this work we have demonstrated that chromium and nickel oxide nanoparticles can be prepared by gelatin method. X-Ray diffraction (XRD) show that mean particle size for chromium oxide of 15-150 nm and nickel oxide of 90 nm were obtained for several temperature of sintering. The X-Ray powder diffraction pattern were performed using Synchrotron Radiation X-Ray source at XRD1 beamline in National Laboratory of Light Synchrotron (LNLS). (author)

Control of synchrotron x-ray diffraction by means of standing acoustic waves

International Nuclear Information System (INIS)

Zolotoyabko, E.; Quintana, J.P.

2004-01-01

Synchrotron x-ray diffraction measurements in quartz crystals of different thickness excited by standing acoustic waves were carried out at the Advanced Photon Source of Argonne National Laboratory. We demonstrated the ability to significantly modify the quartz rocking curves for 20-25 keV x rays by changing the shear wave parameters in the frequency range between 15 and 105 MHz. Dynamic deformation introduced into the crystal lattice by acoustic waves resulted in a remarkable broadening of the rocking curves. The broadening effect strongly depends on the strength of the ultrasound, which can be easily regulated by changing the acoustic amplitude or frequency near the resonance. The maximum rocking curve broadening reached 17 times, which corresponds to the wavelength band, Δλ/λ=4x10 -3 , when used as a monochromator or analyzer for 20-25 keV x rays. The initial rocking curve shape is restored by sweeping the acoustic frequency within a 50-100 kHz range near the resonance. The tunable broadening effect allows effective manipulation of x-ray intensities in time domain. Time-resolved x-ray diffraction measurements under a 19.6 MHz acoustic wave excitation were performed by synchronizing the acoustic wave and x-ray burst periodicity. We used the fact that twice per period the standing wave produces a zero net deformation across the crystal thickness. By introducing an oscillating delay to the acoustic excitation, we were able to effectively change the phase of the acoustic wave relative to the x-ray burst periodicity. The x-ray diffraction intensity was strongly affected by tuning the timing of the x-ray arrivals to the minimum or maximum acoustic deformation. A deep modulation of x rays was observed in a wide frequency range between 0.1 Hz and 1 MHz, which certifies that acoustically excited quartz crystals can potentially be used as slow and fast x-ray modulators with high duty cycle

In Situ High Resolution Synchrotron X-Ray Powder Diffraction Studies of Lithium Batteries

DEFF Research Database (Denmark)

Amri, Mahrez; Fitch, Andy; Norby, Poul

2015-01-01

allowing diffraction information to be obtained from only the active material during battery operation [2]. High resolution synchrotron x-ray powder diffraction technique has been undertaken to obtain detailed structural and compositional information during lithiation/delithiation of commercial LiFePO4...... materials [3]. We report results from the first in situ time resolved high resolution powder diffraction experiments at beamline ID22/31 at the European Synchrotron Radiation Facility, ESRF. We follow the structural changes during charge of commercial LiFePO4 based battery materials using the Rietveld...... method. Conscientious Rietveld analysis shows slight but continuous deviation of lattice parameters from those of the fully stoichiometric end members LiFePO4 and FePO4 indicating a subsequent variation of stoichiometry during cathode delithiation. The application of an intermittent current pulses during...

Diffraction enhanced x-ray imaging

International Nuclear Information System (INIS)

Thomlinson, W.; Zhong, Z.; Johnston, R.E.; Sayers, D.

1997-09-01

Diffraction enhanced imaging (DEI) is a new x-ray radiographic imaging modality using synchrotron x-rays which produces images of thick absorbing objects that are almost completely free of scatter. They show dramatically improved contrast over standard imaging applied to the same phantoms. The contrast is based not only on attenuation but also the refraction and diffraction properties of the sample. The diffraction component and the apparent absorption component (absorption plus extinction contrast) can each be determined independently. This imaging method may improve the image quality for medical applications such as mammography

Synchrotron X-ray diffraction and imaging of ancient Chinese bronzes

International Nuclear Information System (INIS)

Young, M.L.; Dunand, D.C.; Casadio, F.; Schnepp, S.; Almer, J.; Haeffner, D.R.

2006-01-01

High-energy synchrotron X-ray diffraction and imaging experiments were performed at the Advanced Photon Source on two ancient Chinese bronzes from the Art Institute of Chicago with the goal to nondestructively study their microstructure. The first object, a bronze fragment from an early Western Zhou dynasty vessel (Hu, 11th/10th century B.C.), was investigated with spatially-resolved diffraction to reveal the depth and composition of the surface corrosion layer as well as the composition and grain size of the underlying bronze core. The second object, a bronze dagger-axe (Ge, 3rd/2nd century B.C.) with a silver-inlaid sheath, was studied under both diffraction and imaging conditions. It was found to have been cast as a single object, answering longstanding scholars' questions on whether the ceremonial object concealed an interior blade. (orig.)

Hut clusters on Ge(001) surfaces studied by STM and synchrotron X-ray diffraction

DEFF Research Database (Denmark)

Nielsen, M.; Smilgies, D.-M.; Feidenhans'l, R.

1996-01-01

Nanoscale hut clusters formed on Ge(001) surfaces by depositing one monolayer of indium and annealing at temperatures between 350 and 500 degrees C were studied by scanning tunnelling microscopy and synchrotron X-ray diffraction. It was found that the hut clusters form regular arrays over...

Application of focused-beam flat-sample method to synchrotron powder X-ray diffraction with anomalous scattering effect

International Nuclear Information System (INIS)

Tanaka, M; Katsuya, Y; Matsushita, Y

2013-01-01

The focused-beam flat-sample method (FFM), which is a method for high-resolution and rapid synchrotron X-ray powder diffraction measurements by combination of beam focusing optics, a flat shape sample and an area detector, was applied for diffraction experiments with anomalous scattering effect. The advantages of FFM for anomalous diffraction were absorption correction without approximation, rapid data collection by an area detector and good signal-to-noise ratio data by focusing optics. In the X-ray diffraction experiments of CoFe 2 O 4 and Fe 3 O 4 (By FFM) using X-rays near the Fe K absorption edge, the anomalous scattering effect between Fe/Co or Fe 2+ /Fe 3+ can be clearly detected, due to the change of diffraction intensity. The change of observed diffraction intensity as the incident X-ray energy was consistent with the calculation. The FFM is expected to be a method for anomalous powder diffraction.

Probing deformation substructure by synchrotron X-ray diffraction and dislocation dynamics modelling.

Science.gov (United States)

Korsunsky, Alexander M; Hofmann, Felix; Song, Xu; Eve, Sophie; Collins, Steve P

2010-09-01

Materials characterization at the nano-scale is motivated by the desire to resolve the structural aspects and deformation behavior at length scales relevant to those mechanisms that define the novel and unusual properties of nano-structured materials. A range of novel techniques has recently become accessible with the help of synchrotron X-ray beams that can be focused down to spot sizes of less than a few microns on the sample. The unique combination of tunability (energy selection), parallelism and brightness of synchrotron X-ray beams allows their use for high resolution diffraction (determination of crystal structure and transformations, analysis of dislocation sub-structures, orientation and texture analysis, strain mapping); small angle X-ray scattering (analysis of nano-scale voids and defects; orientation analysis) and imaging (radiography and tomography). After a brief review of the state-of-the-art capabilities for monochromatic and white beam synchrotron diffraction, we consider the usefulness of these techniques for the task of bridging the gap between experiment and modeling. Namely, we discuss how the experiments can be configured to provide information relevant to the validation and improvement of modeling approaches, and also how the results of various simulations can be post-processed to improve the possibility of (more or less) direct comparison with experiments. Using the example of some recent experiments carried out on beamline 116 at Diamond Light Source near Oxford, we discuss how such experimental results can be interpreted in view and in conjunction with numerical deformation models, particularly those incorporating dislocation effects, e.g., finite-element based pseudo-continuum strain gradient formulations, and discrete dislocation simulations. Post-processing of FE and discrete dislocation simulations is described, illustrating the kind of information that can be extracted from comparisons between modeling and experimental data.

Simultaneous, single-pulse, synchrotron x-ray imaging and diffraction under gas gun loading

Energy Technology Data Exchange (ETDEWEB)

Fan, D.; Luo, S. N., E-mail: sluo@pims.ac.cn [The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610031 (China); Key Laboratory of Advanced Technologies of Materials, Ministry of Education, Southwest Jiaotong University, Chengdu, Sichuan 610031 (China); Huang, J. W.; Zeng, X. L.; Li, Y.; E, J. C.; Huang, J. Y. [The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610031 (China); Sun, T.; Fezzaa, K. [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Wang, Z. [Physics Division P-25, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

2016-05-15

We develop a mini gas gun system for simultaneous, single-pulse, x-ray diffraction and imaging under high strain-rate loading at the beamline 32-ID of the Advanced Photon Source. In order to increase the reciprocal space covered by a small-area detector, a conventional target chamber is split into two chambers: a narrowed measurement chamber and a relief chamber. The gas gun impact is synchronized with synchrotron x-ray pulses and high-speed cameras. Depending on a camera’s capability, multiframe imaging and diffraction can be achieved. The proof-of-principle experiments are performed on single-crystal sapphire. The diffraction spots and images during impact are analyzed to quantify lattice deformation and fracture; fracture is dominated by splitting cracks followed by wing cracks, and diffraction peaks are broadened likely due to mosaic spread. Our results demonstrate the potential of such multiscale measurements for studying high strain-rate phenomena at dynamic extremes.

Three-Dimensional X-Ray Diffraction Technique for Metals Science

DEFF Research Database (Denmark)

Zhang, Yubin; Fan, Guohua

2017-01-01

The three-dimensional X-ray diffraction (3DXRD) is a new, advanced technique for materials characterization. This technique utilizes high-energy synchrotron X-rays to characterize the 3D crystallographic structure and strain/stress state of bulk materials. As the measurement is non......-destructive, the microstructural evolution as a function of time can be followed, i.e. it allows 4D (x, y, z characterizations, t). The high brilliance of synchrotron X-rays ensures that diffraction signals from volumes of micrometer scale can be quickly detected and distinguished from the background noise, i.e. its spatial...... implemented in several large synchrotron facilities, e.g. the Advanced Photon Source (APS) in USA and the Spring-8 in Japan. Another family of 3DXRD technique that utilizes white beam synchrotron X-rays has also been developed in parallel in cooperation between Oak Ridge National Laboratory and APS...

X-ray diffraction studies of Pompeian wall paintings using synchrotron radiation and dedicated laboratory made systems

International Nuclear Information System (INIS)

Duran, A.; Castaing, J.; Walter, P.

2010-01-01

The full identification of artwork materials requires not only elemental analysis but also structural information of the compounds as provided by X-ray diffraction (XRD). This is easily done when taking samples (or micro-samples) from artworks. However, there is an increasing interest in performing non-destructive studies that require adapted XRD systems. Comparative study of synchrotron high-resolution X-ray powder diffraction (SR-HRPD) and laboratory non-destructive systems (portable XRD and micro-XRD) is the main objective of this work. There are no qualitative differences among the three systems as for detected phases in the Pompeian wall paintings that were studied, except in the case of minority phases which only were detected by SR-HRPD. The identified pigments were goethite, hematite, cinnabar, glauconite, Pompeian blue, together with calcite, dolomite and aragonite. Synchrotron XRD diagrams show better resolution than the others. In general, the peak widths in the diagrams obtained with the portable XRD system are similar to those obtained by micro-diffraction equipment. Factors such as residual divergence of X-ray sources, incidence angle and slit or collimator size are discussed in relation with the quality of XRD diagrams. (orig.)

High-energy synchrotron x-ray diffraction studies on disordered materials. From ambient condition to an extreme condition

International Nuclear Information System (INIS)

Kohara, Shinji; Ohishi, Yasuo; Suzuya, Kentaro; Takata, Masaki

2007-01-01

High-energy x-rays from synchrotron radiation source allow us to measure high-quality diffraction data of the disordered materials from under ambient condition to an extreme condition, which is necessary to reveal the detailed structure of glass, liquid, and amorphous materials. We introduce the high-energy x-ray diffraction beamline and dedicated diffractometer for glass, liquid, and amorphous materials with the recent developments of ancillary equipments. Furthermore our recent studies on the structures of disordered materials reviewed. (author)

Source assemblage types for cratonic diamonds from X-ray synchrotron diffraction

Science.gov (United States)

Nestola, F.; Alvaro, M.; Casati, M. N.; Wilhelm, H.; Kleppe, A. K.; Jephcoat, A. P.; Domeneghetti, M. C.; Harris, J. W.

2016-11-01

Three single crystals of clinopyroxene trapped within three different gem-quality diamonds from the Udachnaya kimberlite (Siberia, Russia) were analysed in situ by single-crystal synchrotron X-ray diffraction in order to obtain information on their chemical composition and infer source assemblage type. A non-destructive approach was used with high-energy (≈ 60 keV; λ ≈ 0.206 Å) at I15, the extreme-conditions beamline at Diamond Light Source. A dedicated protocol was used to center the mineral inclusions located deep inside the diamonds in the X-ray beam. Our results reveal that two of the inclusions can be associated with peridotitic paragenesis whereas the third is eclogitic. This study also demonstrates that this non-destructive experimental approach is extremely efficient in evaluating the origin of minerals trapped in their diamond hosts.

CCD [charge-coupled device] sensors in synchrotron x-ray detectors

International Nuclear Information System (INIS)

Strauss, M.G.; Naday, I.; Sherman, I.S.; Kraimer, M.R.; Westbrook, E.M.; Zaluzec, N.J.

1987-01-01

The intense photon flux from advanced synchrotron light sources, such as the 7-GeV synchrotron being designed at Argonne, require integrating-type detectors. Charge-coupled devices (CCDs) are well suited as synchrotron x-ray detectors. When irradiated indirectly via a phosphor followed by reducing optics, diffraction patterns of 100 cm 2 can be imaged on a 2 cm 2 CCD. With a conversion efficiency of ∼1 CCD electron/x-ray photon, a peak saturation capacity of >10 6 x rays can be obtained. A programmable CCD controller operating at a clock frequency of 20 MHz has been developed. The readout rate is 5 x 10 6 pixels/s and the shift rate in the parallel registers is 10 6 lines/s. The test detector was evaluated in two experiments. In protein crystallography diffraction patterns have been obtained from a lysozyme crystal using a conventional rotating anode x-ray generator. Based on these results we expect to obtain at a synchrotron diffraction images at the rate of ∼1 frame/s or a complete 3-dimensional data set from a single crystal in ∼2 min. 16 refs., 16 figs., 2 tabs

Characterisation of microfocused beam for synchrotron powder diffraction using a new X-ray camera

International Nuclear Information System (INIS)

Thomas, C; Potter, J; Tang, C C; Lennie, A R

2012-01-01

The powder diffraction beamline I11, Diamond Light Source, is being continually upgraded as requirements of the user community evolve. Intensities of X-rays from the I11 in-vacuum electron undulator in the 3 GeV synchrotron fall off at higher energies. By focusing higher energy X-rays, we can overcome flux limitations, and open up new diffraction experiments. Here, we describe characterisation of microfocusing using compound refractive lenses (CRL). For a relatively modest outlay, we have developed an experimental setup and a novel X-ray camera with good sensitivity and a resolution specification suitable for characterising these focusing optics. We show that vertical oscillations in the focused beam compromise resolution of the source imaged by the CRL. Nevertheless, we have measured CRL focusing properties, and demonstrate the use of energy scanning to determine lens alignment. Real benefits of the intensity gain are illustrated.

Synchrotron x-ray diffraction study of liquid surfaces

DEFF Research Database (Denmark)

Als-Nielsen, Jens Aage; Pershan, P.S.

1983-01-01

A spectrometer for X-ray diffraction and refraction studies of horizontal, free surfaces of liquids is described. As an illustration smetic-A layering at the surface of a liquid crystal is presented.......A spectrometer for X-ray diffraction and refraction studies of horizontal, free surfaces of liquids is described. As an illustration smetic-A layering at the surface of a liquid crystal is presented....

In situ synchrotron X-ray diffraction study on epitaxial-growth dynamics of III–V semiconductors

Science.gov (United States)

Takahasi, Masamitu

2018-05-01

The application of in situ synchrotron X-ray diffraction (XRD) to the molecular-beam epitaxial (MBE) growth of III–V semiconductors is overviewed along with backgrounds of the diffraction theory and instrumentation. X-rays are sensitive not only to the surface of growing films but also to buried interfacial structures because of their large penetration depth. Moreover, a spatial coherence length up to µm order makes X-rays widely applicable to the characterization of low-dimensional structures, such as quantum dots and wires. In situ XRD studies during growth were performed using an X-ray diffractometer, which was combined with an MBE chamber. X-ray reciprocal space mapping at a speed matching a typical growth rate was achieved using intense X-rays available from a synchrotron light source and an area detector. The importance of measuring the three-dimensional distribution of XRD intensity in a reciprocal space map is demonstrated for the MBE growth of two-, one-, and zero-dimensional structures. A large amount of information about the growth process of two-dimensional InGaAs/GaAs(001) epitaxial films has been provided by three-dimensional X-ray reciprocal mappings, including the anisotropic strain relaxation, the compositional inhomogeneity, and the evolution of surface and interfacial roughness. For one-dimensional GaAs nanowires grown in a Au-catalyzed vapor-liquid–solid mode, the relationship between the diameter of the nanowires and the formation of polytypes has been suggested on the basis of in situ XRD measurements. In situ three-dimensional X-ray reciprocal space mapping is also shown to be useful for determining the lateral and vertical sizes of self-assembled InAs/GaAs(001) quantum dots as well as their internal strain distributions during growth.

Investigation of hepatic fibrosis with synchrotron X-ray diffraction enhanced imaging

International Nuclear Information System (INIS)

Li Hui; Beijing Univ., Health Science Center, Beijing; Wang Xueyan; Zhao Tao; Hu Chunhong; Lu Weiyuan; Luo Shuqian; Wang Tailing; Wang Baoen; Zhao Xinyan; Zhu Peiping; Huang Wanxia; Yuan Qingxi; Wang Junyue

2008-01-01

In this paper, imaging investigation of hepatic fibrosis in rats induced by human albumin with hard X-ray diffraction enhanced imaging (DEI) is reported. The experiments were performed at 4W1A beamline of Beijing Synchrotron Radiation Facility (BSRF). The results show that great differences can be observed in DEI images between the normal and diseased rats in different stages of liver fibrosis. The difference can also be revealed by the profile curve and texture measurements on regions of interest. The results show that DEI may be a potential way for diagnosis of hepatic fibrosis. (authors)

Applications of synchrotron X-rays in microelectronics industry research

International Nuclear Information System (INIS)

Jordan-Sweet, Jean L.; Detavernier, Christophe; Lavoie, Christian; Mooney, Patricia M.; Toney, Michael F.

2005-01-01

The high flux and density of X-rays produced at synchrotrons provide the microelectronics industry with a powerful probe of the structure and behavior of a wide array of solid materials that are being developed for use in devices of the future. They also are of great use in determining why currently-used materials and processes sometimes fail. This paper describes the X20 X-ray beamline facility operated by IBM at the National Synchrotron Light Source, and presents a series of three industry challenges and results that illustrate the variety of techniques used and problems addressed. The value of this research ranges from solving short-term, technically specific problems to increasing our academic understanding of materials in general. Techniques discussed include high-resolution diffraction, time-resolved diffraction, texture measurements, and grazing-incidence diffraction

ENDIX. A computer program to simulate energy dispersive X-ray and synchrotron powder diffraction diagrams

International Nuclear Information System (INIS)

Hovestreydt, E.; Karlsruhe Univ.; Parthe, E.; Benedict, U.

1987-01-01

A Fortran 77 computer program is described which allows the simulation of energy dispersive X-ray and synchrotron powder diffraction diagrams. The input consists of structural data (space group, unit cell dimensions, atomic positional and displacement parameters) and information on the experimental conditions (chosen Bragg angle, type of X-ray tube and applied voltage or operating power of synchrotron radiation source). The output consists of the normalized intensities of the diffraction lines, listed by increasing energy (in keV), and of an optional intensity-energy plot. The intensities are calculated with due consideration of the wave-length dependence of both the anomalous dispersion and the absorption coefficients. For a better agreement between observed and calculated spectra provision is made to optionally superimpose, on the calculated diffraction line spectrum, all additional lines such as fluorescence and emission lines and escape peaks. The different effects which have been considered in the simulation are discussed in some detail. A sample calculation of the energy dispersive powder diffraction pattern of UPt 3 (Ni 3 Sn structure type) is given. Warning: the user of ENDIX should be aware that for a successful application it is necessary to adapt the program to correspond to the actual experimental conditions. Even then, due to the only approximately known values of certain functions, the agreement between observed and calculated intensities will not be as good as for angle dispersive diffraction methods

Optimizing Monocapillary Optics for Synchrotron X-ray Diffraction, Fluorescence Imaging, and Spectroscopy Applications

International Nuclear Information System (INIS)

Bilderback, Donald H.; Kazimirov, Alexander; Gillilan, Richard; Cornaby, Sterling; Woll, Arthur; Zha, Chang-Sheng; Huang Rong

2007-01-01

A number of synchrotron x-ray applications such as powder diffraction in diamond anvil cells, microbeam protein crystallography, x-ray fluorescence imaging, etc. can benefit from using hollow glass monocapillary optics to improve the flux per square micron on a sample. We currently draw glass tubing into the desired elliptical shape so that only one-bounce under total reflection conditions is needed to bring the x-ray beam to a focus at a 25 to 50 mm distance beyond the capillary tip. For modest focal spot sizes of 10 to 20 microns, we can increase the intensity per square micron by factors of 10 to 1000. We show some of the results obtained at CHESS and Hasylab with capillaries focusing 5 to 40 keV radiation, their properties, and how even better the experimental results could be if more ideal capillaries were fabricated in the future

Non-destructive synchrotron X-ray diffraction mapping of a Roman painting

International Nuclear Information System (INIS)

Dooryhee, E.; Anne, M.; Hodeau, J.-L.; Martinetto, P.; Rondot, S.; Bardies, I.; Salomon, J.; Walter, P.; Vaughan, G.B.M.

2005-01-01

The history and the properties of materials are deduced not only from their elemental and molecular signatures, but also from their exact phase compositions, and from the structures and the defects of their constituents. Here we implement a non-destructive synchrotron X-ray based method, which combines both the quantitative structural content of diffraction and the imaging mode. As a demonstration case, the pigments of a Roman wall painting are examined. The joined elemental and mineral maps mimic the major features of the painting. Different structural phases made of common atomic elements are differentiated. Textures and graininess are measured and related to the artist's know-how. (orig.)

X-ray diffraction imaging of biological cells

CERN Document Server

Nakasako, Masayoshi

2018-01-01

In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL ex...

Synchrotron-Radiation Induced X-Ray Emission (SRIXE)

Energy Technology Data Exchange (ETDEWEB)

Jones, Keith W.

1999-09-01

and increase in scientific use can be maintained for the synchrotron x-ray source. A short summary of the present state of the synchrotron radiation-induced x-ray emission (SRIXE) method is presented here. Basically, SRIXE experiments can include any that depend on the detection. of characteristic x-rays produced by the incident x-ray beam born the synchrotron source as they interact with a sample. Thus, experiments done to measure elemental composition, chemical state, crystal, structure, and other sample parameters can be considered in a discussion of SRIXE. It is also clear that the experimentalist may well wish to use a variety of complementary techniques for study of a given sample. For this reason, discussion of computed microtomography (CMT) and x-ray diffraction is included here. It is hoped that this present discussion will serve as a succinct introduction to the basic ideas of SRIXE for those not working in the field and possibly help to stimulate new types of work by those starting in the field as well as by experienced practitioners of the art. The topics covered include short descriptions of (1) the properties of synchrotron radiation, (2) a description of facilities used for its production, (3) collimated microprobe, (4) focused microprobes, (5) continuum and monoenergetic excitation, (6) detection limits, (7) quantitation, (8) applications of SRIXE, (9) computed microtomography (CMT), and (10)chemical speciation using x-ray absorption near-edge structure (XANES) and extended x-ray absorption fine structure (EXAFS). An effort has been made to cite a wide variety of work from different laboratories to show the vital nature of the field.

Synchrotron-Radiation Induced X-Ray Emission (SRIXE)

International Nuclear Information System (INIS)

Jones, Keith W.

1999-01-01

and increase in scientific use can be maintained for the synchrotron x-ray source. A short summary of the present state of the synchrotron radiation-induced x-ray emission (SRIXE) method is presented here. Basically, SRIXE experiments can include any that depend on the detection. of characteristic x-rays produced by the incident x-ray beam born the synchrotron source as they interact with a sample. Thus, experiments done to measure elemental composition, chemical state, crystal, structure, and other sample parameters can be considered in a discussion of SRIXE. It is also clear that the experimentalist may well wish to use a variety of complementary techniques for study of a given sample. For this reason, discussion of computed microtomography (CMT) and x-ray diffraction is included here. It is hoped that this present discussion will serve as a succinct introduction to the basic ideas of SRIXE for those not working in the field and possibly help to stimulate new types of work by those starting in the field as well as by experienced practitioners of the art. The topics covered include short descriptions of (1) the properties of synchrotron radiation, (2) a description of facilities used for its production, (3) collimated microprobe, (4) focused microprobes, (5) continuum and monoenergetic excitation, (6) detection limits, (7) quantitation, (8) applications of SRIXE, (9) computed microtomography (CMT), and (10)chemical speciation using x-ray absorption near-edge structure (XANES) and extended x-ray absorption fine structure (EXAFS). An effort has been made to cite a wide variety of work from different laboratories to show the vital nature of the field

Light source for synchrotron radiation x-ray topography study at Beijing Synchrotron Radiation Laboratory (BSRL)

International Nuclear Information System (INIS)

Zhao Jiyong; Jiang Jianhua; Tian Yulian

1992-01-01

Characteristics of the synchrotron radiation source for X-ray topography study at Beijing Synchrotron Radiation Laboratory (BSRL) is described, local geometrical resolution of topographies is discussed, and the diffracting intensities of white beam topography is given

Study of gold nanoparticle synthesis by synchrotron x-ray diffraction and fluorescence

Science.gov (United States)

Yan, Zhongying; Wang, Xiao; Yu, Le; Moeendarbari, Sina; Hao, Yaowu; Cai, Zhonghou; Cheng, Xuemei

Gold nanoparticles have a wide range of potential applications, including therapeutic agent delivery, catalysis, and electronics. Recently a new process of hollow nanoparticle synthesis was reported, the mechanism of which was hypothesized to involve electroless deposition around electrochemically evolved hydrogen bubbles. However, the growth mechanism still needs experimental evidence. We report investigation of this synthesis process using synchrotron x-ray diffraction and fluorescence measurements performed at beamline 2-ID-D of the Advanced Photon Source (APS). A series of gold nanoparticle samples with different synthesis time (50-1200 seconds) were deposited using a mixture electrolyte solution of Na3Au(SO3)2 and H4N2NiO6S2 on anodic aluminum oxide (AAO) membranes. The 2D mapping of fluorescence intensity and comparison of x-ray diffraction peaks of the samples have provided valuable information on the growth mechanism. Work at Bryn Mawr College and University of Texas at Arlington is supported by NSF Grants (1207085 and 1207377) and use of the APS at Argonne National Laboratory is supported by the U. S. Department of Energy under Contract No. DE-AC02-06CH11357.

A new miniature microchannel plate X-ray detector for synchrotron radiation

International Nuclear Information System (INIS)

Rosemeier, R.G.; Green, R.E. Jr.

1982-01-01

A state-of-the-art microchannel plate detector has been developed which allows real time X-ray imaging of X-ray diffraction as well as radiographic phenomenon. Advantages of the device include a 50 mm X-ray input, length less than 4'', and a weight of less than 1 lb. Since the use of synchrotron radiation is greatly facilitated by the capability of remote viewing of X-ray diffraction or radiographic images in real time, a prototype electro-optical system has been designed which couples the X-ray microchannel plate detector with a solid state television camera. Advantages of the miniature, lightweight, X-ray synchrotron camera include a large 50 mm X-ray input window, an output signal that is available in both analog format for display on a television monitor and in digital format for computer processing, and a completely modular design which allows all the components to be exchanged for other components optimally suited for the desired applications. (orig.)

A multiple CCD X-ray detector and its first operation with synchrotron radiation X-ray beam

CERN Document Server

Suzuki, M; Kumasaka, T; Sato, K; Toyokawa, H; Aries, I F; Jerram, P A; Ueki, T

1999-01-01

A 4x4 array structure of 16 identical CCD X-ray detector modules, called the multiple CCD X-ray detector system (MCCDX), was submitted to its first synchrotron radiation experiment at the protein crystallography station of the RIKEN beamline (BL45XU) at the SPring-8 facility. An X-ray diffraction pattern of cholesterol powder was specifically taken in order to investigate the overall system performance.

The phase problem and perspectives of surface X-ray diffraction

International Nuclear Information System (INIS)

Tajiri, Hiroo; Takahashi, Toshio

2009-01-01

The emergence of synchrotron radiation sources has accelerated the application of diffraction techniques to surface sciences. Surface X-ray diffraction has become the state-of-the-art technique for determining ordered structures of atoms on crystal surfaces. We introduce surface X-ray diffraction briefly from the historical point of view and describe the concept that not only determine constellation of surface atoms but also view surface atoms as image. The progress in experimental and theoretical studies of surface X-ray diffraction including crystallographic direct methods is reviewed. (author)

X-radiation damage of hydrated lecithin membranes detected by real-time X-ray diffraction using wiggler-enhanced synchrotron radiation as the ionizing radiation source

International Nuclear Information System (INIS)

Caffrey, M.; Cornell Univ., Ithaca, NY

1984-01-01

Radiation damage of hydrated lecithin membranes brought about by exposure to wiggler-derived synchrotron radiation at 8.3 keV (1.5 A) is reported. Considerable damage was observed with exposures under 1 h at an incident flux density of 3 x 10 10 photons s -1 mm -2 , corresponding to a cumulative radiation dose of <= 10 MRad. Damage was so dramatic as to be initially observed while making real-time X-ray diffraction measurements on the sample. The damaging effects of 8.3 keV X-rays on dispersions of dipalmitoyllecithin and lecithin derived from hen egg yolk are as follows: (1) marked changes were noted in the X-ray diffraction behaviour, indicating disruption of membrane stacking. (2) Chemical breakdown of lecithin was observed. (3) The X-ray beam visibly damaged the sample and changed the appearance of the lipid dispersion, when viewed under the light microscope. Considering the importance of X-ray diffraction as a structural probe and the anticipated use of synchrotron radiation in studies involving membranes, the problem of radiation damage must be duly recognized. Furthermore, since dipalmitoyllecithin, the major lipid used in the present study, is a relatively stable compound, it is not unreasonable to expect that X-ray damage may be a problem with other less stable biological and non-biological materials. These results serve to emphasize that whenever a high intensity X-ray source is used, radiation damage can be a problem and that the sensitivity of the sample must always be evaluated under the conditions of measurement. (orig.)

Combining operando synchrotron X-ray tomographic microscopy and scanning X-ray diffraction to study lithium ion batteries

Science.gov (United States)

Pietsch, Patrick; Hess, Michael; Ludwig, Wolfgang; Eller, Jens; Wood, Vanessa

2016-06-01

We present an operando study of a lithium ion battery combining scanning X-ray diffraction (SXRD) and synchrotron radiation X-ray tomographic microscopy (SRXTM) simultaneously for the first time. This combination of techniques facilitates the investigation of dynamic processes in lithium ion batteries containing amorphous and/or weakly attenuating active materials. While amorphous materials pose a challenge for diffraction techniques, weakly attenuating material systems pose a challenge for attenuation-contrast tomography. Furthermore, combining SXRD and SRXTM can be used to correlate processes occurring at the atomic level in the crystal lattices of the active materials with those at the scale of electrode microstructure. To demonstrate the benefits of this approach, we investigate a silicon powder electrode in lithium metal half-cell configuration. Combining SXRD and SRXTM, we are able to (i) quantify the dissolution of the metallic lithium electrode and the expansion of the silicon electrode, (ii) better understand the formation of the Li15Si4 phase, and (iii) non-invasively probe kinetic limitations within the silicon electrode. A simple model based on the 1D diffusion equation allows us to qualitatively understand the observed kinetics and demonstrates why high-capacity electrodes are more prone to inhomogeneous lithiation reactions.

Combining operando synchrotron X-ray tomographic microscopy and scanning X-ray diffraction to study lithium ion batteries

Science.gov (United States)

Pietsch, Patrick; Hess, Michael; Ludwig, Wolfgang; Eller, Jens; Wood, Vanessa

2016-01-01

We present an operando study of a lithium ion battery combining scanning X-ray diffraction (SXRD) and synchrotron radiation X-ray tomographic microscopy (SRXTM) simultaneously for the first time. This combination of techniques facilitates the investigation of dynamic processes in lithium ion batteries containing amorphous and/or weakly attenuating active materials. While amorphous materials pose a challenge for diffraction techniques, weakly attenuating material systems pose a challenge for attenuation-contrast tomography. Furthermore, combining SXRD and SRXTM can be used to correlate processes occurring at the atomic level in the crystal lattices of the active materials with those at the scale of electrode microstructure. To demonstrate the benefits of this approach, we investigate a silicon powder electrode in lithium metal half-cell configuration. Combining SXRD and SRXTM, we are able to (i) quantify the dissolution of the metallic lithium electrode and the expansion of the silicon electrode, (ii) better understand the formation of the Li15Si4 phase, and (iii) non-invasively probe kinetic limitations within the silicon electrode. A simple model based on the 1D diffusion equation allows us to qualitatively understand the observed kinetics and demonstrates why high-capacity electrodes are more prone to inhomogeneous lithiation reactions. PMID:27324109

Synchrotron X-ray diffraction investigations on strains in the oxide layer of an irradiated Zircaloy fuel cladding

Energy Technology Data Exchange (ETDEWEB)

Chollet, Mélanie, E-mail: melanie.chollet@psi.ch [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland); Valance, Stéphane; Abolhassani, Sousan; Stein, Gene [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland); Grolimund, Daniel [Paul Scherrer Institute, SLS, 5232 Villigen (Switzerland); Martin, Matthias; Bertsch, Johannes [Paul Scherrer Institute, NES, 5232 Villigen (Switzerland)

2017-05-15

For the first time the microstructure of the oxide layer of a Zircaloy-2 cladding after 9 cycles of irradiation in a boiling water reactor has been analyzed with synchrotron micro-X-ray diffraction. Crystallographic strains of the monoclinic and to some extent of the tetragonal ZrO{sub 2} are depicted through the thick oxide layer. Thin layers of sub-oxide at the oxide-metal interface as found for autoclave-tested samples and described in the literature, have not been observed in this material maybe resulting from irradiation damage. Shifts of selected diffraction peaks of the monoclinic oxide show that the uniform strain produced during oxidation is orientated in the lattice and displays variations along the oxide layer. Diffraction peaks and their shifts from families of diffracting planes could be translated into a virtual tensor. This virtual tensor exhibits changes through the oxide layer passing by tensile or compressive components. - Highlights: •A Zircaloy-2 cladding irradiated 9 cycles was investigated thanks to synchrotron X-ray diffraction. •Microstructure and uniform strain through the oxide layer is revealed. •The m-ZrO{sub 2} uniform strain is oriented presenting compression along the (−111) plane. •Virtual tensor is built based on reflecting planes of families of grains. •Tensor components vary from tensile to compressive along the oxide layer.

Synchrotron X-ray diffraction investigations on strains in the oxide layer of an irradiated Zircaloy fuel cladding

International Nuclear Information System (INIS)

Chollet, Mélanie; Valance, Stéphane; Abolhassani, Sousan; Stein, Gene; Grolimund, Daniel; Martin, Matthias; Bertsch, Johannes

2017-01-01

For the first time the microstructure of the oxide layer of a Zircaloy-2 cladding after 9 cycles of irradiation in a boiling water reactor has been analyzed with synchrotron micro-X-ray diffraction. Crystallographic strains of the monoclinic and to some extent of the tetragonal ZrO 2 are depicted through the thick oxide layer. Thin layers of sub-oxide at the oxide-metal interface as found for autoclave-tested samples and described in the literature, have not been observed in this material maybe resulting from irradiation damage. Shifts of selected diffraction peaks of the monoclinic oxide show that the uniform strain produced during oxidation is orientated in the lattice and displays variations along the oxide layer. Diffraction peaks and their shifts from families of diffracting planes could be translated into a virtual tensor. This virtual tensor exhibits changes through the oxide layer passing by tensile or compressive components. - Highlights: •A Zircaloy-2 cladding irradiated 9 cycles was investigated thanks to synchrotron X-ray diffraction. •Microstructure and uniform strain through the oxide layer is revealed. •The m-ZrO 2 uniform strain is oriented presenting compression along the (−111) plane. •Virtual tensor is built based on reflecting planes of families of grains. •Tensor components vary from tensile to compressive along the oxide layer.

Fracture mechanics by three-dimensional crack-tip synchrotron X-ray microscopy.

Science.gov (United States)

Withers, P J

2015-03-06

To better understand the relationship between the nucleation and growth of defects and the local stresses and phase changes that cause them, we need both imaging and stress mapping. Here, we explore how this can be achieved by bringing together synchrotron X-ray diffraction and tomographic imaging. Conventionally, these are undertaken on separate synchrotron beamlines; however, instruments capable of both imaging and diffraction are beginning to emerge, such as ID15 at the European Synchrotron Radiation Facility and JEEP at the Diamond Light Source. This review explores the concept of three-dimensional crack-tip X-ray microscopy, bringing them together to probe the crack-tip behaviour under realistic environmental and loading conditions and to extract quantitative fracture mechanics information about the local crack-tip environment. X-ray diffraction provides information about the crack-tip stress field, phase transformations, plastic zone and crack-face tractions and forces. Time-lapse CT, besides providing information about the three-dimensional nature of the crack and its local growth rate, can also provide information as to the activation of extrinsic toughening mechanisms such as crack deflection, crack-tip zone shielding, crack bridging and crack closure. It is shown how crack-tip microscopy allows a quantitative measure of the crack-tip driving force via the stress intensity factor or the crack-tip opening displacement. Finally, further opportunities for synchrotron X-ray microscopy are explored.

Load transfer in bovine plexiform bone determined by synchrotron x-ray diffraction

International Nuclear Information System (INIS)

Akhtar, R.; Daymond, M.; Almer, J.; Mummery, P.; The Univ. of Manchester; Queen's Univ.

2008-01-01

High-energy synchrotron x-ray diffraction (XRD) has been used to quantify load transfer in bovine plexiform bone. By using both wide-angle and small-angle XRD, strains in the mineral as well as the collagen phase of bone were measured as a function of applied compressive stress. We suggest that a greater proportion of the load is borne by the more mineralized woven bone than the lamellar bone as the applied stress increases. With a further increase in stress, load is shed back to the lamellar regions until macroscopic failure occurs. The reported data fit well with reported mechanisms of microdamage accumulation in bovine plexiform bone

High-pressure X-ray diffraction experiments on US using synchrotron radiation

International Nuclear Information System (INIS)

Olsen, J.S.; Steenstrup, S.

1983-12-01

High-pressure X-ray diffraction studies have been performed on US up to 40 GPa using synchrotron radiation and a diamond anvil cell. The measured value of the bulk modulus B 0 = 92 GPa is in reasonable agreement with calculations. The high-pressure behaviour indicates a phase transformation to US III at about 15 GPa. The transformation is a smooth deformation process, which starts with a tetragonal structure asub(tetr) = asub(cub)/√2, csub(tetr) = 2asub(cub) and continues with an orthorhombic structure with a = 375(3)pm, b = 345(3)pm, c = 1069 (24)pm at 35 GPa; it is of second order nature within experimental errors and it should involve some contributions from uranium f electrons. (orig.)

High-energy X-ray diffraction studies of disordered materials

International Nuclear Information System (INIS)

Kohara, Shinji; Suzuya, Kentaro

2003-01-01

With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices (wigglers and undulators), the high-energy (E≥50 keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. High-energy X-ray diffraction has several advantages: higher resolution in real space due to a wide range of scattering vector Q, smaller correction terms (especially the absorption correction), reduction of truncation errors, the feasibility of running under extreme environments, including high-temperatures and high-pressures, and the ability to make direct comparisons between X-ray and neutron diffraction data. Recently, high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available

Time-resolved x-ray diffraction measurement of C60 under high pressure and temperature using synchrotron radiation

International Nuclear Information System (INIS)

Horikawa, T; Suito, K; Kobayashi, M; Onodera, A

2002-01-01

C 60 has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12.5 and 14.3 GPa) and high temperature (up to 800 deg. C) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C 60 structure are presented and the relevance to the hardness of materials derived from C 60 is discussed

X-ray diffraction studies on single and mixed confectionery fats using synchrotron radiation

International Nuclear Information System (INIS)

MacMillan, S.C.; Roberts, K.J.; Wells, M.; Polgreen, M.; Smith, I.

1999-01-01

Full text: Understanding and refining the molecular-scale processes involved in the manufacture of structured materials such as long-chain hydrocarbon compounds is important in many commercial areas such as the petrochemical, biochemical, food, pharmaceutical and soap industries. In such processes crystallisation is an important separation, purification and preparation technique. Despite this our knowledge of the crystallisation process itself is surprisingly limited. In order to improve the crystallisation of confectionery fats, the crystallisation of it's main component, cocoa butter fat, must be properly understood. Cocoa butter fat can exhibit up to 6 polymorphic forms of different crystallographic structures with melting points varying from 17.3 deg C to 36.3 deg C. During the production of chocolate it is essential to control the polymorphic form of fats present, in order to produce a final product with the correct physical and rheological properties. Both shear rate and temperature are thought to play a crucial role in this process. The most widely used method for studying polymorphism is X-ray diffraction. Typical X-ray diffraction patterns of fats exhibit two groups of diffraction lines corresponding to the long and short spacings. The long spacings correspond to the planes formed by the methyl end groups and are dependent on the chain length and the angle of tilt of the component fatty acids of the glyceride molecules. The short spacings refer to the cross sectional packing of the hydrocarbon chain and are independent of the chain length. The relationship between crystallisation rate, polymorphic form, shear and the fat composition has for the first time been quantified, which will enable more accurate control of the polymorhic form in chocolate production. This has been achieved by developing an improved in-situ cell for X-ray studies. The X-ray studies are necessary for the examination of on-line studies under well controlled conditions of temperature

X-ray diffraction studies on single and mixed confectionery fats using synchrotron radiation

Energy Technology Data Exchange (ETDEWEB)

MacMillan, S.C.; Roberts, K.J.; Wells, M.; Polgreen, M.; Smith, I. [Heriot-Watt University, Edinburgh, (United Kingdom). Department of Mechanical and Chemical Engineering, Centre for Molecular and Interface Engineering

1999-12-01

Full text: Understanding and refining the molecular-scale processes involved in the manufacture of structured materials such as long-chain hydrocarbon compounds is important in many commercial areas such as the petrochemical, biochemical, food, pharmaceutical and soap industries. In such processes crystallisation is an important separation, purification and preparation technique. Despite this our knowledge of the crystallisation process itself is surprisingly limited. In order to improve the crystallisation of confectionery fats, the crystallisation of it`s main component, cocoa butter fat, must be properly understood. Cocoa butter fat can exhibit up to 6 polymorphic forms of different crystallographic structures with melting points varying from 17.3 deg C to 36.3 deg C. During the production of chocolate it is essential to control the polymorphic form of fats present, in order to produce a final product with the correct physical and rheological properties. Both shear rate and temperature are thought to play a crucial role in this process. The most widely used method for studying polymorphism is X-ray diffraction. Typical X-ray diffraction patterns of fats exhibit two groups of diffraction lines corresponding to the long and short spacings. The long spacings correspond to the planes formed by the methyl end groups and are dependent on the chain length and the angle of tilt of the component fatty acids of the glyceride molecules. The short spacings refer to the cross sectional packing of the hydrocarbon chain and are independent of the chain length. The relationship between crystallisation rate, polymorphic form, shear and the fat composition has for the first time been quantified, which will enable more accurate control of the polymorhic form in chocolate production. This has been achieved by developing an improved in-situ cell for X-ray studies. The X-ray studies are necessary for the examination of on-line studies under well controlled conditions of temperature

In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

DEFF Research Database (Denmark)

Yue, Zhao; Grivel, Jean-Claude; He, Dong

2012-01-01

In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential ther......In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry...

High pressure phases of uranium monophosphide studied by synchrotron X-ray diffraction

International Nuclear Information System (INIS)

Staun Olson, J.; Gerward, L.; Benedict, U.; Dabos, S.; Vogt, O.

1988-01-01

X-ray diffraction studies have been performed on UP powder for pressures up to 51 GPa using synchrotron radiation and a diamond anvil cell. At ambient pressure UP has the rocksalt structure. The bulk modulus has been determined to B 0 = 102(4) GPa and its pressure derivative to B 0 ' = 4.0(8). The cubic phase has been found to transform to a new phase, UP II, at about 10 GPa. UP II can be characterized by a rhombohedral Bravais lattice. UP II transforms to an orthorhombic phase, UP III, at 28 GPa. No volume change has been observed at the two transitions. The influence of the 5f electrons on the transformations is discussed. (orig.)

X-ray and synchrotron methods in studies of cultural heritage sites

Energy Technology Data Exchange (ETDEWEB)

Koval’chuk, M. V.; Yatsishina, E. B.; Blagov, A. E.; Tereshchenko, E. Yu., E-mail: elenatereschenko@yandex.ru; Prosekov, P. A.; Dyakova, Yu. A. [National Research Centre “Kurchatov Institute” (Russian Federation)

2016-09-15

X-ray and synchrotron methods that are most widely used in studies of cultural heritage objects (including archaeological sites)—X-ray diffraction analysis, X-ray spectroscopy, and visualization techniques— have been considered. The reported examples show high efficiency and informativeness of natural science studies when solving most diverse problems of archaeology, history, the study of art, museology, etc.

X-ray and synchrotron methods in studies of cultural heritage sites

International Nuclear Information System (INIS)

Koval’chuk, M. V.; Yatsishina, E. B.; Blagov, A. E.; Tereshchenko, E. Yu.; Prosekov, P. A.; Dyakova, Yu. A.

2016-01-01

X-ray and synchrotron methods that are most widely used in studies of cultural heritage objects (including archaeological sites)—X-ray diffraction analysis, X-ray spectroscopy, and visualization techniques— have been considered. The reported examples show high efficiency and informativeness of natural science studies when solving most diverse problems of archaeology, history, the study of art, museology, etc.

A synchrotron X-ray diffraction study of non-proportional strain-path effects

International Nuclear Information System (INIS)

Collins, D.M.; Erinosho, T.; Dunne, F.P.E.; Todd, R.I.; Connolley, T.; Mostafavi, M.; Kupfer, H.; Wilkinson, A.J.

2017-01-01

Common alloys used in sheet form can display a significant ductility benefit when they are subjected to certain multiaxial strain paths. This effect has been studied here for a polycrystalline ferritic steel using a combination of Nakajima bulge testing, X-ray diffraction during biaxial testing of cruciform samples and crystal plasticity finite element (CPFE) modelling. Greatest gains in strain to failure were found when subjecting sheets to uniaxial loading followed by balanced biaxial deformation, resulting in a total deformation close to plane-strain. A combined strain of approximately double that of proportional loading was achieved. The evolution of macrostrain, microstrain and texture during non-proportional loading were evaluated by in-situ high energy synchrotron diffraction. The results have demonstrated that the inhomogeneous strain accumulation from non-proportional deformation is strongly dependent on texture and the applied strain-ratio of the first deformation pass. Experimental diffraction evidence is supported by results produced by a novel method of CPFE-derived diffraction simulation. Using constitutive laws selected on the basis of good agreement with measured lattice strain development, the CPFE model demonstrated the capability to replicate ductility gains measured experimentally.

Thermal stability of retained austenite in TRIP steels studied by synchrotron X-ray diffraction during cooling

International Nuclear Information System (INIS)

Dijk, N.H. van; Butt, A.M.; Zhao, L.; Sietsma, J.; Offerman, S.E.; Wright, J.P.; Zwaag, S. van der

2005-01-01

We have performed in situ X-ray diffraction measurements at a synchrotron source in order to study the thermal stability of the retained austenite phase in transformation induced plasticity steels during cooling from room temperature to 100 K. A powder analysis of the diffraction data reveals a martensitic transformation of part of the retained austenite during cooling. The fraction of austenite that transforms during cooling is found to depend strongly on the bainitic holding time and the composition of the steel. It is shown that that austenite grains with a lower average carbon concentration have a lower stability during cooling

Time-resolved x-ray diffraction measurement of C{sub 60} under high pressure and temperature using synchrotron radiation

Energy Technology Data Exchange (ETDEWEB)

Horikawa, T [Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531 (Japan); Suito, K [Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531 (Japan); Kobayashi, M [Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531 (Japan); Onodera, A [Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531 (Japan)

2002-11-11

C{sub 60} has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12.5 and 14.3 GPa) and high temperature (up to 800 deg. C) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C{sub 60} structure are presented and the relevance to the hardness of materials derived from C{sub 60} is discussed.

X-ray stress measurement by use of synchrotron radiation source

International Nuclear Information System (INIS)

Yoshioka, Yasuo; Matsui, Hisaaki; Moro-oka, Toshimasa; Hasegawa, Ken-ichi; Nakajima, Tetsuo.

1986-01-01

In the field of X-ray stress measurement of polycrystalline materials, a diffraction plane at higher Bragg angle has to be selected in order to obtain the precise value of stress. However, the stress measurement on an optional (hkl) plane desired is not always possible because the X-ray beam exited from a metal target has a dispersive wave length. Recently, we have been able to use the synchrotron radiation source (SR) as an excellent X-ray source. In Japan, the facility of synchrotron radiation (Photon Factory, PF) was constructed in the National Laboratory for High Energy Physics (KEK) at Tsukuba academic city. The use of this SR enables the stress measurements on many (hkl) planes with high accuracy in the higher Bragg angle region by providing an X-ray beam having an optional wave length. We have started the X-ray stress analysis by use of the synchrotron radiation source. This paper reports the system of measurement and some results of preliminaly experiments. Since a monochromatic X-ray beam is required for the stress measurement, we used a beam line which consists of a double crystal monochrometer and a focusing mirror. X-rays between 4 KeV (λ = 0.31 nm) and 10 KeV (λ = 0.12 nm) are available with this optical system. We adopted a constant Bragg angle of 2θ = 154 deg for all the diffraction planes. A PSPC having a carbon fiber anode is made and used as a detector with the use of a fast digital signal processor. We could observe the diffraction profiles from (200), (211), (220), (310) and (321) crystal plane of alpha iron, respectively, and the residual stresses in these planes except the (200) plane were measured with high accuracy in a short time. Such feature especially suits the stress analysis of the material which has preferred orientation or stress gradient. (author)

An introduction to three-dimensional X-ray diffraction microscopy

DEFF Research Database (Denmark)

Poulsen, Henning Friis

2012-01-01

Three-dimensional X-ray diffraction microscopy is a fast and nondestructive structural characterization technique aimed at studies of the individual crystalline elements (grains or subgrains) within millimetre-sized polycrystalline specimens. It is based on two principles: the use of highly...... penetrating hard X-rays from a synchrotron source and the application of tomographic reconstruction algorithms for the analysis of the diffraction data. In favourable cases, the position, morphology, phase and crystallographic orientation can be derived for up to 1000 elements simultaneously. For each grain...

Synchrotron x-ray fluorescence and extended x-ray absorption fine structure analysis

International Nuclear Information System (INIS)

Chen, J.R.; Gordon, B.M.; Hanson, A.L.; Jones, K.W.; Kraner, H.W.; Chao, E.C.T.; Minkin, J.A.

1984-01-01

The advent of dedicated synchrotron radiation sources has led to a significant increase in activity in many areas of science dealing with the interaction of x-rays with matter. Synchrotron radiation provides intense, linearly polarized, naturally collimated, continuously tunable photon beams, which are used to determine not only the elemental composition of a complex, polyatomic, dilute material but also the chemical form of the elements with improved accuracy. Examples of the application of synchrotron radiation include experiments in synchrotron x-ray fluorescence (SXRF) analysis and extended x-ray absorption fine structure (EXAFS) analysis. New synchrotron radiation x-ray microprobes for elemental analysis in the parts per billion range are under construction at several laboratories. 76 references, 24 figures

High-pressure X-ray diffraction studies on ThS up to 40 GPa using synchrotron radiation

International Nuclear Information System (INIS)

Benedict, U.; Spirlet, J.C.; Gerward, L.; Olsen, J.S.

1983-12-01

High-pressure X-ray diffraction studies have been performed on ThS up to 40 GPa using synchrotron radiation and a diamond anvil cell. The measured value of the bulk modulus B 0 =145 GPa is in disagreement with a previous measurement. The high-pressure behaviour indicates a phase transformation to ThS II starting at 15 to 20 GPa. The transformation is of second order nature, the resulting structure can be described as distorted fcc. (orig.)

High pressure X-ray diffraction studies on ThS up to 40 GPa using synchrotron radiation

International Nuclear Information System (INIS)

Benedict, U.; Spirlet, J.C.; Gerward, L.; Olsen, J.S.

1984-01-01

High pressure X-ray diffraction studies (up to 40 GPa) were performed on ThS using synchrotron radiation and a diamond anvil cell. The measured value of 145 GPa for the bulk modulus B 0 disagrees with a previous measurement. The high pressure behaviour indicates a phase transformation to ThS II starting at 15 - 20 GPa. The transformation is of the second-order type, and the resulting structure can be described as distorted f.c.c. (Auth.)

Thermal behaviour of molecular sieves (SAPO-11/AIPO-11 type) investigated by synchrotron radiation X-ray diffraction (SRXD)

International Nuclear Information System (INIS)

Neissendorfer, F.; Jahn, E.; Gusenko, S.N.; Sheromov, M.A.

1991-01-01

The structure of molecular sieves is important for a successful application as a catalyzer. The final structure of the synthetic product depends on the technological steps. This process was investigated by in-situ Synchrotron radiation X-ray diffraction. Structural changes in the molecular sieves exist not only during the heating process but also during the following cooling process. (author) 3 figs., 2 refs

High-pressure synchrotron x-ray diffraction and infrared microspectroscopy: applications to dense hydrous phases

CERN Document Server

Liu, Z; Yang, H; Mao Ho Kwang; Hemley, R J

2002-01-01

Synchrotron x-ray diffraction (XRD) and infrared (IR) absorption spectra of hydrous and 'anhydrous' forms of phase X were measured to 30 GPa at room temperature. Three OH stretching modes were found in the hydrous phase, and surprisingly one sharp OH mode was observed in the previously characterized anhydrous phase. All OH stretching modes soften and broaden with increasing pressure and become very weak above approx 20 GPa. XRD indicates that the crystal structure remains stable up to 30 GPa. Combining IR absorption and XRD results, the behaviour is attributed to pressure-induced distortion of the Si sub 2 O sub 7 groups and disorder of the hydrogen atoms. The bulk moduli of the hydrous and 'anhydrous' phases are in the region of 74 GPa.

Diffractive-refractive optics: (+,-,-,+) X-ray crystal monochromator with harmonics separation

Czech Academy of Sciences Publication Activity Database

Hrdý, Jaromír; Mikulík, P.; Oberta, Peter

2011-01-01

Roč. 18, č. 2 (2011), s. 299-301 ISSN 0909-0495 R&D Projects: GA MPO FR-TI1/412 Institutional research plan: CEZ:AV0Z10100522 Keywords : diffractive-refractive optics * x-ray synchrotron radiation monochromator * x-ray crystal monochromator * harmonics separation Subject RIV: BH - Optics, Masers, Lasers Impact factor: 2.726, year: 2011

Texture of poled tetragonal PZT detected by synchrotron X-ray diffraction and micromechanics analysis

International Nuclear Information System (INIS)

Hall, D.A.; Steuwer, A.; Cherdhirunkorn, B.; Withers, P.J.; Mori, T.

2005-01-01

The texture and lattice elastic strain due to electrical poling of tetragonal PZT (lead zirconate titanate) ceramics have been measured using high energy synchrotron X-ray diffraction. It is shown that XRD peak intensity ratios associated with crystal planes of the form {002}, {112} and {202} exhibit a linear dependence on cos-bar 2 Ψ, where Ψ represents the orientation angle between the plane normal and the macroscopic poling axis. The observed dependence of texture and lattice strain on the grain orientation can be understood on the basis that the macroscopic strain due to poling is the average of the poling strains of all the individual grains

New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging

DEFF Research Database (Denmark)

Ludwig, W.; King, A.; Reischig, P.

2009-01-01

Non-destructive, three-dimensional (3D) characterization of the grain structure in mono-phase polycrystalline materials is an open challenge in material science. Recent advances in synchrotron based X-ray imaging and diffraction techniques offer interesting possibilities for mapping 3D grain shapes....... A recent extension of this methodology, termed X-ray diffraction contrast tomography (DCT), combines the principles of X-ray diffraction imaging, three-dimensional X-ray diffraction microscopy (3DXRD) and image reconstruction from projections. DCT provides simultaneous access to 3D grain shape...

Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Bonanno, P.L., E-mail: plb2@njit.edu [Georgia Institute of Technology/GTL, UMI 2958 Georgia Tech-CNRS, 57070 Metz (France); Gautier, S. [LMOPS + UMI: Laboratoire Matériaux Optiques, Photonique et micro-nano Systèmes, UMR CNRS 7132, Université de Metz et SUPELEC, 2 rue E. Belin, 57070 Metz, France, UMI 2958 Georgia Tech-CNRS, 57070 Metz (France); Gmili, Y.El.; Moudakir, T. [UMI 2958 Georgia Tech-CNRS, 57070 Metz (France); Sirenko, A.A. [Department of Physics, New Jersey Institute of Technology, Newark, NJ 07102 (United States); Kazimirov, A. [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, NY 14853 (United States); Cai, Z.-H. [Advanced Photon Source, 9700 S. Cass Avenue, Argonne, IL 60439 (United States); Martin, J. [LMOPS + UMI: Laboratoire Matériaux Optiques, Photonique et micro-nano Systèmes, UMR CNRS 7132, Université de Metz et SUPELEC, 2 rue E. Belin, 57070 Metz, France, UMI 2958 Georgia Tech-CNRS, 57070 Metz (France); Goh, W.H. [Georgia Institute of Technology/GTL, UMI 2958 Georgia Tech-CNRS, 57070 Metz (France); Martinez, A.; Ramdane, A.; Le Gratiet, L. [Laboratoire de Photonique et de Nanostructures, UPR CNRS 20, Route de Nozay, 91460 Marcoussis (France); Maloufi, N. [Laboratoire d' Etude des Textures et Application aux Matériaux UMR CNRS 7078 Ile du Saulcy 57045 METZ cedex 1 (France); Assouar, M.B. [Laboratoire de Physique des Milieux Ionisés et Applications, Nancy University, CNRS, BP 239, F-54506 Vandoeuvre-lès-Nancy Cédex (France); Ougazzaden, A. [Georgia Institute of Technology/GTL, UMI 2958 Georgia Tech-CNRS, 57070 Metz (France)

2013-08-31

Submicron beam synchrotron-based X-ray diffraction (XRD) techniques have been developed and used to accurately and nondestructively map chemical composition and material quality of selectively grown group III-nitride nanowires. GaN, AlGaN, and InGaN multi-quantum-well nanowires have been selectively grown on lattice matched and mismatched substrates, and the challenges associated with obtaining and interpreting submicron beam XRD results are addressed and solved. Nanoscale cathodoluminescence is used to examine exciton behavior, and energy-dispersive X-ray spectroscopy is used to verify chemical composition. Scanning transmission electron microscopy is later used to paint a more complete picture. The advantages of submicron beam XRD over other techniques are discussed in the context of this challenging material system. - Highlights: ► We used nano selective area growth to create nanowires of GaN, AlGaN and InGaN/GaN. ► We characterized them by synchrotron-based submicron beam X-ray diffraction (XRD). ► This technique accurately determined chemical and crystallographic properties. ► Challenges of XRD are addressed in the context of this challenging material system. ► Advantages of XRD over other characterization methods are discussed.

Observation of Structure of Surfaces and Interfaces by Synchrotron X-ray Diffraction: Atomic-Scale Imaging and Time-Resolved Measurements

Science.gov (United States)

Wakabayashi, Yusuke; Shirasawa, Tetsuroh; Voegeli, Wolfgang; Takahashi, Toshio

2018-06-01

The recent developments in synchrotron optics, X-ray detectors, and data analysis algorithms have enhanced the capability of the surface X-ray diffraction technique. This technique has been used to clarify the atomic arrangement around surfaces in a non-contact and nondestructive manner. An overview of surface X-ray diffraction, from the historical development to recent topics, is presented. In the early stage of this technique, surface reconstructions of simple semiconductors or metals were studied. Currently, the surface or interface structures of complicated functional materials are examined with sub-Å resolution. As examples, the surface structure determination of organic semiconductors and of a one-dimensional structure on silicon are presented. A new frontier is time-resolved interfacial structure analysis. A recent observation of the structure and dynamics of the electric double layer of ionic liquids, and an investigation of the structural evolution in the wettability transition on a TiO2 surface that utilizes a newly designed time-resolved surface diffractometer, are presented.

Synchrotron radiation X-ray microfluorescence techniques

Indian Academy of Sciences (India)

Synchrotron X-ray imaging systems with fluorescence techniques was developed for biomedical researches in Brazilian Synchrotron Laboratory. An X-ray fluorescence microtomography system was implemented to analyse human prostate and breast samples and an X-ray microfluorescence system was implemented to ...

Synchrotron X-ray diffraction measurements of internal stresses during loading of steel-based metal matrix composites reinforced with TiB2 particles

International Nuclear Information System (INIS)

Bacon, D.H.; Edwards, L.; Moffatt, J.E.; Fitzpatrick, M.E.

2011-01-01

Highlights: → Synchrotron X-ray diffraction was used to measure internal stresses in Fe-TiB 2 MMCs. → Samples of the MMCs were loaded to failure in situ in the X-ray beam. → The results show good elastic load transfer from the matrix to the reinforcement. → There is good agreement with the predicted elastic stresses from Eshelby modeling. → During plastic deformation there is increasing load transfer to the reinforcement. - Abstract: High-energy synchrotron X-ray diffraction was used to measure the internal strain evolution in the matrix and reinforcement of steel-based metal matrix composites reinforced with particulate titanium diboride (TiB 2 ). Two systems were studied: a 316L matrix with 25% TiB 2 by volume and a W1.4418 matrix with 10% reinforcement. In situ loading experiments were performed, where the materials were loaded uniaxially in the X-ray beam. The results show the strain partitioning between the phases in the elastic regime, and the evolution of the strain partitioning once plasticity occurs. The results are compared with results from Eshelby modelling, and very good agreement is seen between the measured and modelled response for elastic loading of the material. Heat treatment of the 316-based material did not affect the elastic internal strain response.

X-ray radiation damage of organic semiconductor thin films during grazing incidence diffraction experiments

Energy Technology Data Exchange (ETDEWEB)

Neuhold, A., E-mail: alfred.neuhold@tugraz.at [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Novak, J.; Flesch, H.-G.; Moser, A.; Djuric, T. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria); Grodd, L.; Grigorian, S.; Pietsch, U. [Institute of Physics, University Siegen (Germany); Resel, R. [Institute of Solid State Physics, Graz University of Technology, Graz (Austria)

2012-08-01

Since modern synchrotrons with highly intense X-ray beams are in use to investigate organic materials, the stability of soft matter materials during beam exposure is a crucial issue. Grazing incidence X-ray diffraction and specular X-ray reflectivity measurements were performed on thin films of organic semiconducting materials, like poly(3-hexylthiophene) (P3HT), sexithiophene and pentacene. These films were irradiated with an average flux density between 10{sup 15} and 10{sup 16} photons/(s mm{sup 2}) and evidenced a different stability in synchrotron X-ray radiation. The semi-crystalline P3HT showed a clear intensity decrease of the 1 0 0 Bragg peak and 0 2 0 Bragg peak compared to the rather stable diffraction features of the molecular crystals sexithiophene and pentacene. The difference in synchrotron X-ray radiation stability is explained by the interaction of the X-ray beam with the individual chemical components in the molecules as well as by the different crystallinities of the materials. Furthermore, the semi-crystalline P3HT film exhibited an increase of film thickness after irradiation and the surface roughness slightly decreased. To summarize, this study shows a strong influence of synchrotron X-ray radiation to specific organic thin films like e.g. P3HT, while others like pentacene and sexithiophene are observed as quite stable.

Optoelectronic Picosecond Detection of Synchrotron X-rays

Energy Technology Data Exchange (ETDEWEB)

Durbin, Stephen M. [Purdue Univ., West Lafayette, IN (United States)

2017-08-04

The goal of this research program was to develop a detector that would measure x-ray time profiles with picosecond resolution. This was specifically aimed for use at x-ray synchrotrons, where x-ray pulse profiles have Gaussian time spreads of 50-100 ps (FWHM), so the successful development of such a detector with picosecond resolution would permit x-ray synchrotron studies to break through the pulse width barrier. That is, synchrotron time-resolved studies are currently limited to pump-probe studies that cannot reveal dynamics faster than ~50 ps, whereas the proposed detector would push this into the physically important 1 ps domain. The results of this research effort, described in detail below, are twofold: 1) the original plan to rely on converting electronic signals from a semiconductor sensor into an optical signal proved to be insufficient for generating signals with the necessary time resolution and sensitivity to be widely applicable; and 2) an all-optical method was discovered whereby the x-rays are directly absorbed in an optoelectronic material, lithium tantalate, which can then be probed by laser pulses with the desired picosecond sensitivity for detection of synchrotron x-rays. This research program has also produced new fundamental understanding of the interaction of x-rays and optical lasers in materials that has now created a viable path for true picosecond detection of synchrotron x-rays.

X-ray diffraction topography. Stages and tendencies of development

International Nuclear Information System (INIS)

Shul'pina, I.L.

2000-01-01

The physical foundation of X-ray diffraction topography, its methods, the achievements in image theory, the stages of evolution were described in this review. It was found that modern topography is well along in development associated with the use of third-generation synchrotron radiation and with its adaptation to advance materials and problems of materials science. Some proposals about prospects for X-ray topography progress in the future have been made [ru

X-ray Microprobe for Fluorescence and Diffraction Analysis

International Nuclear Information System (INIS)

Ice, G.E.

2005-01-01

X-ray diffraction (see unit 1.1) and x-ray excited fluorescence analysis are powerful techniques for the nondestructive measurement of crystal structure and chemical composition. X-ray fluorescence analysis is inherently nondestructive with orders of magnitude lower power deposited for the same detectable limit as with fluorescence excited by charged particle probes (Sparks, 1980). X-ray diffraction analysis is sensitive to crystal structure with orders-of-magnitude greater sensitivity to crystallographic strain than electron probes (Rebonato, et al. 1989). When a small-area x-ray microbeam is used as the probe, chemical composition (Z>14), crystal structure, crystalline texture, and crystalline strain distributions can be determined. These distributions can be studied both at the surface of the sample and deep within the sample (Fig. 1). Current state-of-the-art can achieve an ∼1 mm-D x-ray microprobe and an ∼0.1 mm-D x-ray microprobe has been demonstrated (Bilderback, et al., 1994). Despite their great chemical and crystallographic sensitivities, x-ray microprobe techniques have until recently been restricted by inefficient x-ray focusing optics and weak x-ray sources; x-ray microbeam analysis was largely superseded by electron techniques in the 50's. However, interest in x-ray microprobe techniques has now been revived (Howells, et al., 1983; Ice and Sparks, 1984; Chevallier, et al., 1997; Riekel 1992; Thompson, el al., 1992; and Making and Using... 1997) by the development of efficient x-ray focusing optics and ultra-high intensity synchrotron x-ray sources (Buras and Tazzari, 1984; Shenoy, et al., 1988). These advances have increased the achievable microbeam flux by more than 11 orders of magnitude (Fig. 2) (Ice, 1997); the flux in a tunable 1 mm-D beam on a 'so called' 3rd-generation synchrotron source such as the APS can exceed the flux in a fixed-energy mm2 beam on a conventional source. These advances make x-ray microfluorescence and x-ray

X-ray diffraction characteristics of curved monochromators for sychrotron radiation

International Nuclear Information System (INIS)

Boeuf, A.; Rustichelli, F.; Mazkedian, S.; Puliti, P.; Melone, S.

1978-01-01

A theoretical study is presented concerning the diffraction characteristics of curved monochromators for X-ray synchrotron radiation used at the laboratories of Hamburg, Orsay and Stanford. The investigation was performed by extending to the X-ray case a simple model recently developed and fruitfully employed to describe the neutron diffraction properties of curved monochromators. Several diffraction patterns were obtained corresponding to different monochromator materials (Ge, Si) used by the different laboratories, for different reflecting planes (111), (220), asymmetry angles, X-ray wave-lengths (Mo Kα, Cu Kα, Cr Kα) and curvature radii. The results are discussed in physical terms and their implications on the design of curved monochromators for synchrotron radiation are presented. In particular, the study shows that all the monochromators used in the different laboratories should behave practically as perfect crystals and therefore should have a very low integrated reflectivity corresponding to an optimized wavelength passband Δlambda/lambda approximately 10 -4 . The gain that can be obtained by increasing the curvature, by introducing a gradient in the lattice spacing or by any other kind of imperfection is quite limited and much lower than the desirable value. The adopted model can help in obtaining a possible moderate gain in intensity by also taking into consideration other parameters, such as crystal material, reflecting plane, asymmetry of the reflection and X-ray wavelength. (Auth.)

X-ray diffraction and imaging with a coherent beam: application to X-ray optical elements and to crystals exhibiting phase inhomogeneities

International Nuclear Information System (INIS)

Masiello, F.

2011-05-01

The exceptional properties of synchrotron light sources have been exploited in very different disciplines, from archaeology to chemistry, from material science to biology, from medicine to physics. Among these properties it is important to mention the high brilliance, continuum spectrum, high degree of polarization, time structure, small source size and divergence of the beam, the last resulting in a high transversal coherence of the produced radiation. This high transversal coherence of the synchrotron sources has permitted the development of new techniques, e.g. phase contrast imaging, X-ray photon correlation spectroscopy and coherent X-ray diffraction imaging (CXDI). This thesis work will consist essentially of three parts. In the first part it will be presented the work done as a member of the X-ray Optics Group of ESRF in the characterization of high quality diamond crystals foreseen as X-ray optical elements. The characterization has been done using different complementary X-ray techniques, such as high resolution diffraction, topography, grazing incidence diffraction, reflectivity and measurements of the coherence preservation using the Talbot effect. In the second part, I will show the result obtained in the study of the temperature behaviours of the domain in periodically poled ferroelectrics crystals. This type of measurements, based on Bragg-Fresnel diffraction, are possible only thanks to the high degree of coherence of the beam. In the third part, I will present the results obtained in the characterization of diamonds foreseen for applications other than X-ray optical elements. (author)

Extended X-ray absorption fine structure and X-ray diffraction studies on supported Ni catalysts

International Nuclear Information System (INIS)

Aldea, N.; Marginean, P.; Yaning, Xie; Tiandou, Hu; Tao, Liu; Wu, Zhongua; ZhenYa, Dai

1999-01-01

In the first part of this paper, we present a study based on EXAFS spectroscopy. This method can yield structural information about the local environment around a specific atomic constituent in the amorphous materials, the location and chemical state of any catalytic atom on any support or point defect structures, in alloys and composites. EXAFS is a specific technique of the scattering of X-ray on materials. The present study is aimed toward elucidation of the local structure of Ni atoms and their interaction with oxide support. The second goal of the paper consists in X-ray diffraction on the same samples. X-ray diffraction method that is capable to determine average particle size, microstrains, probability of faults as well as particle size distribution function of supported Ni catalysts is presented. The method is based on the Fourier analysis of a single X-Ray diffraction profile. The results obtained on supported nickel catalysts, which are used in H/D isotopic exchange reactions are reported. The global structure is obtained with a new fitting method based on the Generalised Fermi Function facilities for approximation and Fourier transform of the experimental X-Ray line profiles. Both types of measurements were performed on Beijing Synchrotron Radiation Facilities (BSRF). (authors)

Non-destructive analysis of micro texture and grain boundary character from X-ray diffraction contrast tomography

DEFF Research Database (Denmark)

King, A.; Herbig, M.; Ludwig, W.

2010-01-01

Recent advances in synchrotron based X-ray imaging and diffraction techniques offer interesting new possibilities for mapping 3D grain shapes and crystallographic orientations in different classes of polycrystalline materials. X-ray diffraction contrast tomography (DCT) is a monochromatic beam...... imaging technique combining the principles of X-ray micro-tomography and three-dimensional X-ray diffraction microscopy (3DXRD). DCT provides simultaneous access to 3D grain shape, crystallographic orientation and attenuation coefficient distribution at the micrometer length scale. The microtexture...

Application of X-rays and Synchrotron X Rays to Residual Stress Evaluation Near Surfaces

International Nuclear Information System (INIS)

Pyzalla, Anke

1999-01-01

A nondestructive residual stress analysis can be performed using diffraction methods. The easiest accessible radiation is characteristic X radiation that has a penetration depth of ∼10 microm suitable for the determination of the residual stresses in near-surface layers. Special techniques have been developed, e.g., with respect to in situ analyses of the stress state in oxide layers and the residual stress analysis in coarse grained zones of steel welds or annealed Ni-base alloys. Depending on the size of the gauge volume, neutron diffraction can provide information at depths of tens of millimetres of steel and many tens of millimetres of Al. An alternative to the use of the characteristic synchrotron radiation is the use of a high-energy polychromatic beam in an energy dispersive arrangement, which gives access to higher penetration depths at still gauge volumes as small as 100 microm x 100 microm x 1 mm in steel rods of 15-mm diameter. The combination of neutrons with conventional X rays and monochromatic and polychromatic synchrotron radiation allows for a comprehensive investigation of the phase composition, the texture, and the residual stresses

Real world issues for the new soft x-ray synchrotron sources

International Nuclear Information System (INIS)

Kincaid, B.M.

1991-05-01

A new generation of synchrotron radiation light sources covering the VUV, soft x-ray and hard x-ray spectral regions is under construction in several countries. They are designed specifically to use periodic magnetic undulators and low-emittance electron or positron beams to produce high-brightness near-diffraction-limited synchrotron radiation beams. An introduction to the properties of undulator radiation is followed by a discussion of some of the challenges to be faced at the new facilities. Examples of predicted undulator output from the Advanced Light Source, a third generation 1--2 GeV storage ring optimized for undulator use, are used to highlight differences from present synchrotron radiation sources, including high beam power, partial coherence, harmonics, and other unusual spectral and angular properties of undulator radiation. 8 refs., 2 figs

Accelerated Synchrotron X-ray Diffraction Data Analysis on a Heterogeneous High Performance Computing System

Energy Technology Data Exchange (ETDEWEB)

Qin, J; Bauer, M A, E-mail: qin.jinhui@gmail.com, E-mail: bauer@uwo.ca [Computer Science Department, University of Western Ontario, London, ON N6A 5B7 (Canada)

2010-11-01

The analysis of synchrotron X-ray Diffraction (XRD) data has been used by scientists and engineers to understand and predict properties of materials. However, the large volume of XRD image data and the intensive computations involved in the data analysis makes it hard for researchers to quickly reach any conclusions about the images from an experiment when using conventional XRD data analysis software. Synchrotron time is valuable and delays in XRD data analysis can impact decisions about subsequent experiments or about materials that they are investigating. In order to improve the data analysis performance, ideally to achieve near real time data analysis during an XRD experiment, we designed and implemented software for accelerated XRD data analysis. The software has been developed for a heterogeneous high performance computing (HPC) system, comprised of IBM PowerXCell 8i processors and Intel quad-core Xeon processors. This paper describes the software and reports on the improved performance. The results indicate that it is possible for XRD data to be analyzed at the rate it is being produced.

Accelerated Synchrotron X-ray Diffraction Data Analysis on a Heterogeneous High Performance Computing System

International Nuclear Information System (INIS)

Qin, J; Bauer, M A

2010-01-01

The analysis of synchrotron X-ray Diffraction (XRD) data has been used by scientists and engineers to understand and predict properties of materials. However, the large volume of XRD image data and the intensive computations involved in the data analysis makes it hard for researchers to quickly reach any conclusions about the images from an experiment when using conventional XRD data analysis software. Synchrotron time is valuable and delays in XRD data analysis can impact decisions about subsequent experiments or about materials that they are investigating. In order to improve the data analysis performance, ideally to achieve near real time data analysis during an XRD experiment, we designed and implemented software for accelerated XRD data analysis. The software has been developed for a heterogeneous high performance computing (HPC) system, comprised of IBM PowerXCell 8i processors and Intel quad-core Xeon processors. This paper describes the software and reports on the improved performance. The results indicate that it is possible for XRD data to be analyzed at the rate it is being produced.

Applications of synchrotron x-ray diffraction topography to fractography

International Nuclear Information System (INIS)

Bilello, J.C.

1983-01-01

Fractographs have been taken using a variety of probes each of which produces different types of information. Methods which have been used to examine fracture surfaces include: (a) optical microscopy, particularly interference contrast methods, (b) scanning electron microscopy (SEM), (c) SEM with electron channelling, (d) SEM with selected-area electron channelling, (e) Berg-Barrett (B-B) topography, and now (f) synchrotron x-radiation fractography (SXRF). This review concentrated on the role that x-ray methods can play in such studies. In particular, the ability to nondestructively assess the subsurface microstructure associated with the fracture to depths of the order of 5 to 10 μm becomes an important attribute for observations of a large class of semi-brittle metals, semiconductors and ceramics

Micro-structural characterization of materials using synchrotron hard X-ray imaging techniques

International Nuclear Information System (INIS)

Agrawal, Ashish; Singh, Balwant; Kashyap, Yogesh; Sarkar, P. S.; Shukla, Mayank; Sinha, Amar

2015-01-01

X-ray imaging has been an important tool to study the materials microstructure with the laboratory based sources however the advent of third generation synchrotron sources has introduced new concepts in X-ray imaging such as phase contrast imaging, micro-tomography, fluorescence imaging and diffraction enhance imaging. These techniques are being used to provide information of materials about their density distribution, porosity, geometrical and morphological characteristics at sub-micron scalewith improved contrast. This paper discusses the development of various imaging techniques at synchrotron based imaging beamline Indus-2 and few recent experiments carried out at this facility

Surface and interface strains studied by x-ray diffraction

International Nuclear Information System (INIS)

Akimoto, Koichi; Emoto, Takashi; Ichimiya, Ayahiko

1998-01-01

The authors have developed a technique of X-ray diffraction in order to measure strain fields near semiconductor surface and interface. The diffraction geometry is using the extremely asymmetric Bragg-case bulk reflection of a small incident angle to the surface and a large angle exiting from the surface. The incident angle of the X-rays is set near critical angle of total reflection by tuning X-ray energy of synchrotron radiation at the Photon Factory, Japan. For thermally grown-silicon oxide/Si(100) interface, the X-ray intensity of the silicon substrate 311 reflection has been measured. From comparison of the full width at half maxima (FWHM) of X-ray rocking curves of various thickness of silicon oxides, it has been revealed that silicon substrate lattice is highly strained in the thin (less than about 5 nm) silicon oxide/silicon system. In order to know the original silicon surface strain, the authors have also performed the same kind of measurements in the ultra-high vacuum chamber. A clean Si(111) 7x7 surface gives sharper X-ray diffraction peak than that of the native oxide/Si(111) system. From these measurements, it is concluded that the thin silicon oxide film itself gives strong strain fields to the silicon substrates, which may be the reason of the existence of the structural transition layer at the silicon oxide/Si interface

Assessment of a synchrotron X-ray method for quantitative analysis of calcium hydroxide

International Nuclear Information System (INIS)

Williams, P. Jason; Biernacki, Joseph J.; Bai Jianming; Rawn, Claudia J.

2003-01-01

Thermogravimetric analysis (TGA) and quantitative X-ray diffraction (QXRD) are widely used to determine the calcium hydroxide (CH) content in cementitious systems containing blends of Portland cement, fly ash, blast furnace slag, silica fume and other pozzolanic and hydraulic materials. These techniques, however, are destructive to cement samples and subject to various forms of error. While precise weight losses can be measured by TGA, extracting information from samples with multiple overlapping thermal events is difficult. And, however, while QXRD can offer easier deconvolution, the accuracy for components below about 5 wt.% is typically poor when a laboratory X-ray source is used. Furthermore, the destructive nature of both techniques prevents using them to study the in situ hydration of a single contiguous sample for kinetic analysis. In an attempt to overcome these problems, the present research evaluated the use of synchrotron X-rays for quantitative analysis of CH. A synchrotron X-ray source was used to develop calibration data for quantification of the amount of CH in mixtures with fly ash. These data were compared to conventional laboratory XRD data for like samples. While both methods were found to offer good quantification, synchrotron XRD (SXRD) provided a broader range of detectability and higher accuracy than laboratory diffraction and removed the subjectivity as compared to TGA analysis. Further, the sealed glass capillaries used with the synchrotron source provided a nondestructive closed, in situ environment for tracking hydrating specimens from zero to any desired age

Thermal expansion and phase transformations of nitrogen-expanded austenite studied with in situ synchrotron X-ray diffraction

DEFF Research Database (Denmark)

Brink, Bastian; Ståhl, Kenny; Christiansen, Thomas Lundin

2014-01-01

Nitrogen-expanded austenite, _N, with high and low nitrogen contents was produced from AISI 316 grade stainless steel powder by gaseous nitriding in ammonia/hydrogen gas mixtures. In situ synchrotron X-ray diffraction was applied to investigate the thermal expansion and thermal stability...... as a fitting parameter. The stacking fault density is constant for temperatures up to 680 K, whereafter it decreases to nil. Surprisingly, a transition phase with composition M4N (M = Fe, Cr, Ni, Mo) appears for temperatures above 770 K. The linear coefficient of thermal expansion depends on the nitrogen...

Higher-order-structure formation in liquid crystal epoxy thermosets investigated by synchrotron radiation-wide-angle X-ray diffraction

International Nuclear Information System (INIS)

Maeda, Rina; Okuhara, Kenta; Nakamura, Akihiro; Hayakawa, Teruaki; Uehara, Yasushi; Motoya, Tsukasa; Nobutoki, Hideharu

2016-01-01

We report the investigation of the mesophase transformations of a liquid crystalline molecule with terminal epoxy groups from the initial stages of curing with a diamine compound. The ordered arrangement of molecules within the smectic layers in the thermoset formed at the end of the curing process was characterized by synchrotron radiation-wide-angle X-ray diffraction (SR-WAXD). Data from this experiment helps us understand the phase transitions from the nematic to smectic phases of curing liquid crystalline epoxies. (author)

Performance characteristics needed for protein crystal diffraction x-ray detectors

International Nuclear Information System (INIS)

Westbrook, E. M.

1999-01-01

During the 1990's, macromolecular crystallography became progressively more dependent on synchrotrons X-ray sources for diffraction data collection. Detectors of this diffraction data at synchrotrons beamlines have evolved over the decade, from film to image phosphor plates, and then to CCD systems. These changes have been driven by the data quality and quantity improvements each newer detector technology provided. The improvements have been significant. It is likely that newer detector technologies will be adopted at synchrotron beamlines for crystallographic diffraction data collection in the future, but these technologies will have to compete with existing CCD detector systems which are already excellent and are getting incrementally better in terms of size, speed, efficiency, and resolving power. Detector development for this application at synchrotrons must concentrate on making systems which are bigger and faster than CCDs and which can capture weak data more efficiently. And there is a need for excellent detectors which are less expensive than CCD systems

X-ray diffraction patterns of single crystals implanted with high-energy light ions

International Nuclear Information System (INIS)

Wieteska, K.

1998-01-01

X-ray diffraction patterns of silicon and gallium arsenide single crystals implanted with high-energy protons and α-particles were studied. A various models of lattice parameter changes were analysed. The agreement between the simulation and experiment proves that the lattice parameter depth-distribution can be assumed to be proportional to vacancy distribution obtained by Monte-Carlo method and from the Biersack-Ziegler theory. Most of the X-ray experiments were performed using synchrotron source of X-ray radiation in particular in the case of back-reflection and transmission section topographic methods. The new method of direct determination of the implanted ion ranges was proposed using synchrotron radiation back-reflection section topography. A number of new interference phenomena was revealed and explained. These interferences are important in the applications of diffraction theory in studying of the real structure of implanted layers. (author)

UV-Visible Absorption Spectroscopy Enhanced X-ray Crystallography at Synchrotron and X-ray Free Electron Laser Sources.

Science.gov (United States)

Cohen, Aina E; Doukov, Tzanko; Soltis, Michael S

2016-01-01

This review describes the use of single crystal UV-Visible Absorption micro-Spectrophotometry (UV-Vis AS) to enhance the design and execution of X-ray crystallography experiments for structural investigations of reaction intermediates of redox active and photosensitive proteins. Considerations for UV-Vis AS measurements at the synchrotron and associated instrumentation are described. UV-Vis AS is useful to verify the intermediate state of an enzyme and to monitor the progression of reactions within crystals. Radiation induced redox changes within protein crystals may be monitored to devise effective diffraction data collection strategies. An overview of the specific effects of radiation damage on macromolecular crystals is presented along with data collection strategies that minimize these effects by combining data from multiple crystals used at the synchrotron and with the X-ray free electron laser.

Texture, residual strain, and plastic deformation around scratches in alloy 600 using synchrotron X-ray Laue micro-diffraction

Energy Technology Data Exchange (ETDEWEB)

Suominen Fuller, M.L. [Surface Science Western, Room G-1, Western Science Centre, University of Western Ontario, London, Ontario, N6A 5B7 (Canada)], E-mail: mfuller@uwo.ca; Klassen, R.J. [Department of Mechanical and Materials Engineering, Room 3002 Spencer Engineering Building, University of Western Ontario, London, Ontario, N6A 5B9 (Canada); McIntyre, N.S. [Surface Science Western, Room G-1, Western Science Centre, University of Western Ontario, London, Ontario, N6A 5B7 (Canada); Gerson, A.R. [Applied Centre for Structural and Synchrotron Studies, Mawson Lakes Campus, University of South Australia, Adelaide, South Australia 5095 (Australia); Ramamurthy, S. [Surface Science Western, Room G-1, Western Science Centre, University of Western Ontario, London, Ontario, N6A 5B7 (Canada); King, P.J. [Babcock and Wilcox Canada, 581 Coronation Blvd., Cambridge, Ontario, N1R5V3 (Canada); Liu, W. [Advanced Photon Source, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne, IL 60439 (United States)

2008-03-15

Deformation around two scratches in Alloy 600 (A600) was studied nondestructively using synchrotron Laue differential aperture X-ray microscopy. The orientation of grains and elastic strain distribution around the scratches were measured. A complex residual deviatoric elastic strain state was found to exist around the scratches. Heavy plastic deformation was observed up to a distance of 20 {mu}m from the scratches. In the region 20-30 {mu}m from the scratches the diffraction spots were heavily streaked and split indicating misoriented dislocation cell structures.

Experimental issues in in-situ synchrotron x-ray diffraction at high pressure and temperature by using a laser-heated diamond-anvil cell

International Nuclear Information System (INIS)

Yoo, C.S.

1997-01-01

An integrated technique of diamond-anvil cell, laser-heating and synchrotron x-ray diffraction technologies is capable of structural investigation of condensed matter in an extended region of high pressures and temperatures above 100 GPa and 3000 K. The feasibility of this technique to obtain reliable data, however, strongly depends on several experimental issues, including optical and x-ray setups, thermal gradients, pressure homogeneity, preferred orientation, and chemical reaction. In this paper, we discuss about these experimental issues together with future perspectives of this technique for obtaining accurate data

Effect of epoxy impregnation on strain distribution of materials in Bi2223 superconducting coils by using synchrotron X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Jin, Xinzhe, E-mail: xinzhe.jin@riken.jp [Center for Life Science Technologies, RIKEN, Yokohama-shi, Kanagawa 230-0045 (Japan); Osamura, Kozo [Research Institute for Applied Sciences, Sakyo-ku, Kyoto 606-8202 (Japan); Machiya, Shutaro [Daido University, Minami-ku, Nagoya 457-8530 (Japan); Kajiwara, Kentaro [Japan Synchrotron Radiation Research Institute, Sayo, Hyogo 679-5198 (Japan); Shobu, Takahisa [Japan Atomic Energy Agency, Sayo, Hyogo 679-5148 (Japan); Maeda, Hideaki [Center for Life Science Technologies, RIKEN, Yokohama-shi, Kanagawa 230-0045 (Japan)

2015-11-25

Synchrotron X-rays have been used to observe strain distributions in composite materials such as superconducting wires with a thickness of less than about 2 mm. In applications that employ wound coils of superconducting wire, it is necessary to understand the strain distribution within the coiled wire. Superconducting wires such as Bi2223 and REBCO wires approximately 4–5 mm wide are commercially available. Coiled wires of this width are too thick to easily measure using conventional X-ray techniques, especially the inner strain, because the penetration depth tends to be around 2 mm. Therefore, the beam penetration must be improved, and it is known that the penetration depth of an X-ray beam depends upon the beam energy, beam intensity, measurement material, and measurement method. In this study, we used a white X-ray diffractometer at SPring-8 to develop a method of observing the strain distribution in Bi2223 superconducting coils winded by a 4.5 mm wide Bi2223 wire. We successfully observed a clear (400) peak of the Bi2223 phase by an appropriate measurement condition, and then observed the strains of each material in the Bi2223 coils with and without epoxy impregnation. This is the first time that we have obtained the strain of a Bi2223 phase in coiled wire using synchrotron X-ray diffraction. Further synchrotron-based study of superconducting coils will be useful in the development of advanced high-field magnets. The appropriate measurement method and the obtained measurement results are presented in this paper. - Highlights: • We successfully obtained clear peaks of Bi2223 phase in 4.5 mm thick coils. • The strain behaviors of materials in the coil correspond to a three turn cycle model. • A uniform strain distribution of the Bi2223 phase was obtained by epoxy impregnation.

Diffraction enhanced X-ray imaging of mammals crystalline lens

International Nuclear Information System (INIS)

Antunes, A.; Hoennicke, M.G.; Safatle, A.M.V.; Cusatis, C.; Moraes Barros, P.S.; Morelhao, S.L.

2005-01-01

Crystalline lenses are transparent biological materials where the organization of the lens fibers can also be affected by changes at molecular level, and therefore the structure and morphology of the tissue can be correlated to the loss of transparency of the lens. In this work, internal structure of mammal lenses regarding the long-range ordering of the fibers are investigated by diffraction enhanced X-ray imaging (DEI) radiography. Moreover, DEI and absorption X-ray synchrotron radiographs for healthy and cataractous crystalline lenses are compared. Significant differences in healthy and cataractous crystalline lenses are observed

Diffraction anomalous fine structure using X-ray anomalous dispersion

International Nuclear Information System (INIS)

Soejima, Yuji; Kuwajima, Shuichiro

1998-01-01

A use of X-ray anomalous dispersion effects for structure investigation has recently been developed by using synchrotron radiation. One of the interesting method is the observation of anomalous fine structure which arise on diffraction intensity in energy region of incident X-ray at and higher than absorption edge. The phenomenon is so called Diffraction Anomalous Fine Structure (DAFS). DAFS originates in the same physical process an that of EXAFS: namely photoelectric effect at the corresponding atom and the interaction of photoelectron waves between the atom and neighboring atoms. In contrast with EXAFS, the method is available for only the crystalline materials, but shows effective advantages of the structure investigations by a use of diffraction: one is the site selectivity and the other is space selectivity. In the present study, demonstrations of a use of X-ray anomalous dispersion effect for the superstructure determination will be given for the case of PbZrO 3 , then recent trial investigations of DAFS in particular on the superlattice reflections will be introduced. In addition, we discuss about Forbidden Reflection near Edge Diffraction (FRED) which is more recently investigated as a new method of the structure analysis. (author)

The application of synchrotron radiation to X-ray lithography

International Nuclear Information System (INIS)

Spiller, E.; Eastman, D.E.; Feder, R.; Grobman, W.D.; Gudat, W.; Topalian, J.

1976-06-01

Synchrotron radiation from the German electron synchrotron DESY in Hamburg has been used for X-ray lithograpgy. Replications of different master patterns (for magnetic bubble devices, fresnel zone plates, etc.) were made using various wavelengths and exposures. High quality lines down to 500 A wide have been reproduced using very soft X-rays. The sensitivities of X-ray resists have been evaluated over a wide range of exposures. Various critical factors (heating, radiation damage, etc.) involved with X-ray lithography using synchrotron radiation have been studied. General considerations of storage ring sources designed as radiation sources for X-ray lithography are discussed, together with a comparison with X-ray tube sources. The general conclusion is that X-ray lithography using synchrotron radiation offers considerable promise as a process for forming high quality sub-micron images with exposure times as short as a few seconds. (orig.) [de

Synchrotron x-ray microbeam characteristics for x-ray fluorescence analysis

International Nuclear Information System (INIS)

Iida, Atsuo; Noma, Takashi

1995-01-01

X-ray fluorescence analysis using a synchrotron x-ray microprobe has become an indispensable technique for non-destructive micro-analysis. One of the most important parameters that characterize the x-ray microbeam system for x-ray fluorescence analysis is the beam size. For practical analysis, however, the photon flux, the energy resolution and the available energy range are also crucial. Three types of x-ray microbeam systems, including monochromatic and continuum excitation systems, were compared with reference to the sensitivity, the minimum detection limit and the applicability to various types of x-ray spectroscopic analysis. 16 refs., 5 figs

X-ray diffraction at high pressure and high/low temperatures using synchrotron radiation. Applications in the study of spinel structures

International Nuclear Information System (INIS)

Gerward, L.; Jiang, J.Z.; Olsen, J.S.; Recio, J.M.; Wakowska, A.

2004-01-01

High-pressure x-ray diffraction made a quantum leap in the 1960's with the advent of the diamond-anvil cell. This ingenious device, where two opposing diamond faces apply pressure to a tiny sample, made it possible to replicate the pressure near the core of the Earth by turning a thumbscrew. Multianvil cells, such as the Japanese MAX80 press, were developed for combined high-pressure and high-temperature studies. The availability n at about the same time n of dedicated synchrotron radiation sources of hard x-rays was another big step forward. Since then, the white-beam energy-dispersive method has been the workhorse for high pressure, high-temperature x-ray diffraction, although it is now gradually being replaced by high-resolution monochromatic methods based on the image plate, the CCD camera or other electronic area detectors. The first part of the paper is a review of high-pressure x-ray diffraction (HPXRD), covering roughly the last three decades. Physical parameters, such as the bulk modulus, the compressibility and the equation of state, are defined. The diamond-anvil cell, the multianvil press and other high-pressure devices are described, as well as synchrotron radiation sources and recording techniques. Examples are drawn from current experimental and theoretical research on crystal structures of the spinel type. Accurate structural parameters have been determined at ambient conditions and at low temperatures using single-crystal diffraction and four-circle diffractometers. The uniform high-pressure behavior of the oxide spinels has been investigated in detail and compared with the corresponding behavior of selenium-based spinels. The synthesis of advanced novel materials is exemplified in the case of the cubic spinel Si 3 N 4 . This and other nitrogen spinels, which have a bulk modulus of about 300 GPa modulated by the actual cation, are opening a road towards superhard materials. The paper finishes off with an outlook into the future, where new

In Situ X-ray Diffraction Studies of (De)lithiation Mechanism in Silicon Nanowire Anodes

KAUST Repository

Misra, Sumohan; Liu, Nian; Nelson, Johanna; Hong, Seung Sae; Cui, Yi; Toney, Michael F.

2012-01-01

-Si product has been observed. In this work, we use an X-ray transparent battery cell to perform in situ synchrotron X-ray diffraction on SiNWs in real time during electrochemical cycling. At deep lithiation voltages the known metastable Li 15Si 4 phase forms

Note: Application of a pixel-array area detector to simultaneous single crystal x-ray diffraction and x-ray absorption spectroscopy measurements

International Nuclear Information System (INIS)

Sun, Cheng-Jun; Brewe, Dale L.; Heald, Steve M.; Zhang, Bangmin; Chen, Jing-Sheng; Chow, G. M.; Venkatesan, T.

2014-01-01

X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) are two main x-ray techniques in synchrotron radiation facilities. In this Note, we present an experimental setup capable of performing simultaneous XRD and XAS measurements by the application of a pixel-array area detector. For XRD, the momentum transfer in specular diffraction was measured by scanning the X-ray energy with fixed incoming and outgoing x-ray angles. By selecting a small fixed region of the detector to collect the XRD signal, the rest of the area was available for collecting the x-ray fluorescence for XAS measurements. The simultaneous measurement of XRD and X-ray absorption near edge structure for Pr 0.67 Sr 0.33 MnO 3 film was demonstrated as a proof of principle for future time-resolved pump-probe measurements. A static sample makes it easy to maintain an accurate overlap of the X-ray spot and laser pump beam

Analyses of Interaction Phases of U Mo Dispersion Fuel by Synchrotron X ray Diffraction

Energy Technology Data Exchange (ETDEWEB)

Kim, Woo Jeong; Nam, Ji Min; Ryu, Ho Jin; Park, Jong Man [Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of); Herve, Palancher; Charollais, Francois [Saint Paul Lez Durance Cedex, Rhone (France); Bonnin, Anne; Honkimaeki, Veijo [Grenoble Cedex, Grenoble (France); Patrick Lemoined [Gif sur Yvette, Paris (France)

2012-10-15

Gamma phase U Mo alloys are one of the promising candidates to be used as advanced high uranium density fuel for high power research reactors due to their excellent irradiation performance. However, formation of interaction layers between the U Mo particles and Al matrix degrades the irradiation performance of U Mo dispersion fuel. One of the remedies to the interaction problem is a Si addition to the Al matrix. Recent irradiation tests have shown that the use of Al (2{approx}5wt%)Si matrices retarded the growth of interaction layers effectively during irradiation. Recently, KAERI has proposed silicide or nitride coated U Mo fuel for the minimization of the interaction layer growth. The silicide or nitride coatings are expected to act as interdiffusion barriers and their out of pile tests showed the improved diffusion barrier performances of the silicide and nitride layers. In order to characterize constituent phases in the coated layers on U Mo particles and the interaction layers of coated U Mo particle dispersed fuel, synchrotron X ray diffraction experiments have been performed at the ESRF (European Synchrotron Radiation Facility), France as a KAERI CEA cooperation program.

Classification of lead white pigments using synchrotron radiation micro X-ray diffraction

International Nuclear Information System (INIS)

Welcomme, E.; Walter, P.; Menu, M.; Bleuet, P.; Hodeau, J.L.; Dooryhee, E.; Martinetto, P.

2007-01-01

Lead white pigment was used and synthesised for cosmetic and artistic purposes since the antiquity. Ancient texts describe the various recipes, and preparation processes as well as locations of production. In this study, we describe the results achieved on several paint samples taken from Matthias Gruenewald's works. Gruenewald, who was active between 1503 and 1524, was a major painter at the beginning of the German Renaissance. Thanks to X-ray diffraction analysis using synchrotron radiation, it is possible to associate the composition of the paint samples with the masters ancient recipes. Different approaches were used, in reflection and transmission modes, directly on minute samples or on paint cross-sections embedded in resin. Characterisation of lead white pigments reveals variations in terms of composition, graininess and proportion of mineral phases. The present work enlightens the presence of lead white as differentiable main composition groups, which could be specific of a period, a know-how or a geographical origin. In this way, we aim at understanding the choices and the trading of pigments used to realise paintings during northern European Renaissance. (orig.)

Study of overload effects in bainitic steel by synchrotron X-ray diffraction

Directory of Open Access Journals (Sweden)

P. Lopez-Crespo

2013-07-01

Full Text Available This work presents an in-situ characterisation of crack-tip strain fields following an overload by means of synchrotron X-ray diffraction. The study is made on very fine grained bainitic steel, thus allowing a very high resolution so that small changes occurring around the crack-tip were captured along the crack plane at the mid-thickness of the specimen. We have followed the crack as it grew through the overload location. Once the crack-tip has progressed past the overload event there is strong evidence that the crack faces contact in the region of the overload event (though not in the immediate vicinity of the current locations of the crack tip at Kmin even when the crack has travelled 1mm beyond the overload location. It was also found that at Kmax the peak tensile strain ahead of the crack-tip decreases soon after the overload is applied and then gradually recovers as the crack grows past the compressive region created by the overload.

Classification of lead white pigments using synchrotron radiation micro X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Welcomme, E.; Walter, P.; Menu, M. [Centre de Recherche et de Restauration des Musees de France - CNRS UMR 171, Paris (France); Bleuet, P. [European Synchrotron Radiation Facility, BP 220, Grenoble Cedex (France); Hodeau, J.L.; Dooryhee, E.; Martinetto, P. [Institut Neel CNRS-UPR 503-1, 25, Av. des Martyrs, BP 166, Grenoble Cedex 9 (France)

2007-12-15

Lead white pigment was used and synthesised for cosmetic and artistic purposes since the antiquity. Ancient texts describe the various recipes, and preparation processes as well as locations of production. In this study, we describe the results achieved on several paint samples taken from Matthias Gruenewald's works. Gruenewald, who was active between 1503 and 1524, was a major painter at the beginning of the German Renaissance. Thanks to X-ray diffraction analysis using synchrotron radiation, it is possible to associate the composition of the paint samples with the masters ancient recipes. Different approaches were used, in reflection and transmission modes, directly on minute samples or on paint cross-sections embedded in resin. Characterisation of lead white pigments reveals variations in terms of composition, graininess and proportion of mineral phases. The present work enlightens the presence of lead white as differentiable main composition groups, which could be specific of a period, a know-how or a geographical origin. In this way, we aim at understanding the choices and the trading of pigments used to realise paintings during northern European Renaissance. (orig.)

High-energy X-ray diffraction studies of short- and intermediate-range structure in oxide glasses

International Nuclear Information System (INIS)

Suzuya, Kentaro

2002-01-01

The feature of high-energy X-ray diffraction method is explained. The oxide glasses studies by using BL04B2, high-energy X-ray diffraction beam line of SPring-8, and the random system materials by high-energy monochromatic X-ray diffraction are introduced. An advantage of third generation synchrotron radiation is summarized. On SPring-8, the high-energy X-ray diffraction experiments of random system are carried out by BL04B2 and BL14B1 beam line. BL04B2 can select Si (111)(E=37.8 keV, λ=0.033 nm) and Si(220)(E=61.7 keV, λ=0.020 nm) as Si monochromator. The intermediate-range structure of (MgO) x (P 2 O 5 ) 1-x glass ,MgP 2 O 6 glass, B 2 O 3 glass, SiO 2 and GeO 2 are explained in detail. The future and application of high-energy X-ray diffraction are stated. (S.Y.)

CCD[charge-coupled device]-based synchrotron x-ray detector for protein crystallography: Performance projected from an experiment

International Nuclear Information System (INIS)

Strauss, M.G.; Naday, I.; Sherman, I.S.; Kraimer, M.R.; Westbrook, E.M.

1986-01-01

The intense x radiation from a synchrotron source could, with a suitable detector, provide a complete set of diffraction images from a protein crystal before the crystal is damaged by radiation (2 to 3 min). An area detector consisting of a 40 mm dia. x-ray fluorescing phosphor, coupled with an image intensifier and lens to a CCD image sensor, was developed to determine the effectiveness of such a detector in protein crystallography. The detector was used in an experiment with a rotating anode x-ray generator. Diffraction patterns from a lysozyme crystal obtained with this detector are compared to those obtained with film. The two images appear to be virtually identical. The flux of 10 4 x-ray photons/s was observed on the detector at the rotating anode generator. At the 6-GeV synchrotron being designed at Argonne, the flux on an 80 x 80 mm 2 detector is expected to be >10 9 photons/s. The projected design of such a synchrotron detector shows that a diffraction-peak count >10 6 could be obtained in ∼0.5 s. With an additional ∼0.5 s readout time of a 512 x 512 pixel CCD, the data acquisition time per frame would be ∼1 s so that ninety 1 0 diffraction images could be obtained, with approximately 1% precision, in less than 3 min

Slow scan sit detector for x-ray diffraction studies using synchrotron radiation

International Nuclear Information System (INIS)

Milch, J.R.

1978-01-01

A TV-type x-ray detector using a SIT vidicon has been used for biological diffraction studies at the EMBL outstation at DESY, Hamburg, Germany. The detector converts the two-dimensional diffraction pattern to a charge pattern on the vidicon target, which is read out in the slow-scan mode. This detector has high DOE, no count-rate limit, and is simple and inexpensive to construct. Radiation from the storage ring DORIS was used to study the structure of live muscle at various phases of contraction. Typically the count-rate on the detector was 10 6 x-rays/sec and a total exposure of a few seconds was needed to record the weak diffraction from muscle. This compares with usual exposure times of several hours using a rotating anode generator and film

Synchrotron X-ray imaging applied to solar photovoltaic silicon

International Nuclear Information System (INIS)

Lafford, T A; Villanova, J; Plassat, N; Dubois, S; Camel, D

2013-01-01

Photovoltaic (PV) cell performance is dictated by the material of the cell, its quality and purity, the type, quantity, size and distribution of defects, as well as surface treatments, deposited layers and contacts. A synchrotron offers unique opportunities for a variety of complementary X-ray techniques, given the brilliance, spectrum, energy tunability and potential for (sub-) micron-sized beams. Material properties are revealed within in the bulk and at surfaces and interfaces. X-ray Diffraction Imaging (X-ray Topography), Rocking Curve Imaging and Section Topography reveal defects such as dislocations, inclusions, misorientations and strain in the bulk and at surfaces. Simultaneous measurement of micro-X-Ray Fluorescence (μ-XRF) and micro-X-ray Beam Induced Current (μ-XBIC) gives direct correlation between impurities and PV performance. Together with techniques such as microscopy and Light Beam Induced Current (LBIC) measurements, the correlation between structural properties and photovoltaic performance can be deduced, as well as the relative influence of parameters such as defect type, size, spatial distribution and density (e.g [1]). Measurements may be applied at different stages of solar cell processing in order to follow the evolution of the material and its properties through the manufacturing process. Various grades of silicon are under study, including electronic and metallurgical grades in mono-crystalline, multi-crystalline and mono-like forms. This paper aims to introduce synchrotron imaging to non-specialists, giving example results on selected solar photovoltaic silicon samples.

X-ray Diffraction Study of Arsenopyrite at High Pressure

Energy Technology Data Exchange (ETDEWEB)

D Fan; M Ma; W Zhou; S Wei; Z Chen; H Xie

2011-12-31

The high-pressure X-ray diffraction study of a natural arsenopyrite was investigated up to 28.2 GPa using in situ angle-dispersive X-ray diffraction and a diamond anvil cell at National Synchrotron Light Source, Brookhaven National Laboratory. The 16:3:1 methanol-ethanol-water mixture was used as a pressure-transmitting medium. Pressures were measured using the ruby-fluorescence method. No phase change has been observed up to 28.2 GPa. The isothermal equation of state (EOS) was determined. The values of K{sub 0}, and K'{sub 0} refined with a third-order Birch-Murnaghan EOS are K{sub 0} = 123(9) GPa, and K'{sub 0} = 5.2(8). Furthermore, we confirm that the linear compressibilities ({beta}) along a, b and c directions of arsenopyrite is elastically isotropic ({beta}{sub a} = 6.82 x 10{sup -4}, {beta}{sub b} = 6.17 x 10{sup -4} and {beta}{sub c} = 6.57 x 10{sup -4} GPa{sup -1}).

Investigations of the phase transition in V3O5 using energy dispersive X-ray diffraction and synchrotron radiation white beam X-ray topography

International Nuclear Information System (INIS)

Asbrink, S.; Gerward, L.; Staun Olsen, J.

1985-01-01

The reversible first order phase transition in V 3 O 5 at T t =155 0 C has been studied using a specially constructed oven, where the temperature can be kept constant within a few hundredths of a degree for several hours. Energy dispersive diffraction measurements have beem made in a temperature region around the phase transition with the fixed crystal method and the θ/2θ scanning method. White beam X-ray topographs have been obtained from the same crystal in the same temperature region using synchrotron radiation. The integrated intensities of the strong h 0 0 reflections show anomalies that are correlated with the corresponding X-ray topographs. Thus, an unexpected increase of crystal perfection is observed a few hundredths of a degree below T t . The energy dependence of the intensity maximum at T t for strong reflections has been determined and semi-quantitatively explained on the basis of extinction theory. (orig.)

Controlled molecules for X-ray diffraction experiments at free-electron lasers

International Nuclear Information System (INIS)

Stern, Stephan

2013-12-01

X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

Controlled molecules for X-ray diffraction experiments at free-electron lasers

Energy Technology Data Exchange (ETDEWEB)

Stern, Stephan

2013-12-15

X-ray diffractive imaging is at the very heart of materials science and has been utilized for decades to solve unknown molecular structures. Nowadays, it serves as the key method of structural biology to solve molecular structures of large biological molecules comprising several thousand or even millions of atoms. However, X-ray diffraction from isolated molecules is very weak. Therefore, the regular and periodic arrangement of a huge number of identical copies of a certain molecule of interest within a crystal lattice has been a necessary condition in order to exploit Bragg diffraction of X-rays. This results in a huge increase in scattered signal and a strongly improved signal-to-noise ratio compared to diffraction from non-crystalline samples. The major bottleneck of structural biology is that many of biologically interesting molecules refuse to form crystals of sufficient size to be used at synchrotron X-ray lightsources. However, novel X-ray free-electron lasers (XFELs), which became operational very recently, promise to address this issue. X-ray pulses provided by XFELs are many orders of magnitude more intense than X-ray pulses from a synchrotron source and at the same time as short as only several tens of femtoseconds. Combined with wavelengths in the nm-pm range, XFELs are well-suited to study ultrafast atomic and molecular dynamics. Additionally, the ultrashort pulses can be utilized to circumvent the damage threshold which set a limit to the incident intensity in X-ray diffraction experiments before. At XFELs, though eventually destroying the investigated sample, no significant sample deterioration happens on the ultrashort timescale of the XFEL pulse and the measured diffraction pattern is due to an (almost) unharmed sample. In the framework of this thesis, the approach of utilizing the highly intense XFEL pulses for X-ray diffraction of weakly-scattering non-crystalline samples was taken to the limit of small isolated molecules. X-ray diffraction was

Identification of cellulose fibres belonging to Spanish cultural heritage using synchrotron high resolution X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Herrera, L.K.; Justo, A.; Duran, A.; Haro, M.C.J. de; Franquelo, M.L.; Perez Rodriguez, J.L. [CSIC-Seville University, Materials Science Institute of Seville, Seville (Spain)

2010-05-15

A complete characterisation of fibres used in Spanish artwork is necessary to provide a complete knowledge of these natural fibres and their stage of degradation. Textile samples employed as painting supports on canvas and one sample of unprocessed plant material were chosen for this study. All the samples were investigated by synchrotron radiation X-ray diffraction (SR-XRD). Flax and cotton have the Cellulose I structure. The values of the crystalline index (CI) were calculated for both types of fibres. The structure of Cellulose IV was associated with the unprocessed plant material. The information obtained by SR-XRD was confirmed by laboratory techniques including scanning electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR). (orig.)

Structural studies of disordered materials using high-energy x-ray diffraction from ambient to extreme conditions

Energy Technology Data Exchange (ETDEWEB)

Kohara, Shinji [Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan); Itou, Masayoshi [Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan); Suzuya, Kentaro [Japan Atomic Energy Agency (J-PARC/JAEA), Tokai, Naka, Ibaraki 319-1195 (Japan); Inamura, Yasuhiro [Japan Atomic Energy Agency (J-PARC/JAEA), Tokai, Naka, Ibaraki 319-1195 (Japan); Sakurai, Yoshiharu [Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan); Ohishi, Yasuo [Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan); Takata, Masaki [Japan Synchrotron Radiation Research Institute (SPring-8/JASRI), 1-1-1 Kouto, Sayo, Hyogo 679-5198 (Japan)

2007-12-19

High-energy x-rays from a synchrotron radiation source allow us to obtain high-quality diffraction data for disordered materials from ambient to extreme conditions, which is necessary for revealing the detailed structures of glass, liquid and amorphous materials. We introduced high-energy x-ray diffraction beamlines and a dedicated diffractometer for glass, liquid and amorphous materials at SPring-8 and report the recent developments of ancillary equipment. Furthermore, the structures of liquid and amorphous materials determined from the high-energy x-ray diffraction data obtained at SPring-8 are discussed.

X-ray fluorescence imaging with synchrotron radiation

International Nuclear Information System (INIS)

Rivers, M.L.

1987-01-01

The micro-distribution of trace elements is of great interest in fields such as geochemistry, biology and material science. The synchrotron x-ray fluorescence microprobe provides a technique to quantitatively measure trace element compositions at individual points and to construct semiquantitative two dimensional maps of trace element compositions. This paper describes an x-ray fluorescence system used at the National Synchrotron Light Source

X-ray topography using the forward transmitted beam under multiple-beam diffraction conditions

Energy Technology Data Exchange (ETDEWEB)

Tsusaka, Y., E-mail: tsusaka@sci.u-hyogo.ac.jp; Takano, H. [Graduate School of Material Science, University of Hyogo, 3-2-1, Kouto, Kamigori, Hyogo 678-1297 (Japan); Takeda, S. [SPring-8 Service Co., Ltd., 1-20-5, Kouto, Shingu, Tatsuno, Hyogo 679-5165 (Japan); Yokoyama, K.; Matsui, J. [Synchrotron Radiation Nanotechnology Center, University of Hyogo, 1-490-2, Kouto, Shingu, Tatsuno, Hyogo 679-5165 (Japan); Kagoshima, Y. [Graduate School of Material Science, University of Hyogo, 3-2-1, Kouto, Kamigori, Hyogo 678-1297 (Japan); Synchrotron Radiation Nanotechnology Center, University of Hyogo, 1-490-2, Kouto, Shingu, Tatsuno, Hyogo 679-5165 (Japan)

2016-02-15

X-ray topographs are taken for a sapphire wafer with the [0001] surface normal, as an example, by forward transmitted synchrotron x-ray beams combined with two-dimensional electronic arrays in the x-ray detector having a spatial resolution of 1 μm. They exhibit no shape deformation and no position shift of the dislocation lines on the topographs. Since the topography is performed under multiple-beam diffraction conditions, the topographic images of a single diffraction (two-wave approximation condition) or plural diffractions (six-wave approximation condition) can be recorded without large specimen position changes. As usual Lang topographs, it is possible to determine the Burgers vector of each dislocation line. Because of high parallelism of the incoming x-rays and linear sensitivity of the electronic arrays to the incident x-rays, the present technique can be used to visualize individual dislocations in single crystals of the dislocation density as high as 1 × 10{sup 5} cm{sup −2}.

Structure of La2Cu2O5 by high-resolution synchrotron X-ray powder diffraction

International Nuclear Information System (INIS)

La Placa, S.J.; Bringley, J.F.; Scott, B.A.; Cox, D.E.

1993-01-01

Dicopper(II) dilanthanum pentaoxide, La 2 Cu 2 O 5 , M r =484.90, orthorhombic, Pbam. At T=300 K: a=5.5490(1), b=10.4774(2), c=3.8796(1) A, V=225.557(8) A 3 , Z=2, D x =7.139 g cm -3 , λ=1.2000 A. Final R I =6.20, R p =14.6 and R wp =20.61%, 124 independent reflections observed. The structure has been refined from high-resolution synchrotron X-ray powder diffraction data using the Rietveld method. It is of the oxygen-defect perovskite type and is composed entirely of corner-shared CuO 5 square pyramids, which share oxygen vacancies forming vacancy tunnels along the c axis. The La atoms reside at a perovskite-like A-site and are tenfold coordinated by oxygen. (orig.)

Chemical crystallography with pulsed neutrons and synchrotron x-rays

International Nuclear Information System (INIS)

Carrondo, M.A.; Jeffrey, G.A.

1988-01-01

Solid-state chemists and physicists, crystallographers and molecular biologists who are using or who plan to use the special properties of pulsed neutron spallation and synchrotron X-ray sources will find this book invaluable. Those scientists who have not yet gained experience in working with such sources will find the basic physics of the radiations, their production and their scattering properties explained, together with descriptions of the different types of diffraction experiments which use them

Synchrotron X-Ray Footprinting on Tour

OpenAIRE

Bohon, Jen; Ralston, Corie; D'Mello, Rhijuta; Gupta, Sayan; Chance, Mark R.

2014-01-01

Synchrotron X-ray footprinting resources were investigated at a variety of beamlines and synchrotron facilities to understand their potential for a mobile general user. Results indicate that viable resources exist at each synchrotron investigated such that a prospective user need only provide a simple flow apparatus and sample handling accessories to perform this technique.

Nuclear Bragg diffraction using synchrotron radiation

International Nuclear Information System (INIS)

Rueffer, R.; Gerdau, E.; Grote, M.; Hollatz, R.; Roehlsberger, R.; Rueter, H.D.; Sturhahn, W.

1990-01-01

Nuclear Bragg diffraction with synchrotron radiation as source will become a powerful new X-ray source in the A-region. This source exceeds by now the brilliance of conventional Moessbauer sources giving hyperfine spectroscopy further momentum. As examples applications to yttrium iron garnet (YIG) and iron borate will be discussed. (author)

Synchrotron X-radiation research

International Nuclear Information System (INIS)

Kabler, M.N.; Nagel, D.J.; Skelton, E.F.

1990-05-01

The Naval Research Laboratory (NRL) has been involved in the exploitation of X rays since the 1920s. The report gives a brief description of the generation and characteristics of synchrotron radiation, and review highlights of current research. Research examples include soft-X-ray optics, semiconductor surface passivation, surface electron dynamics, space-charge dynamics on silicon, photochemistry on GaAs, local atomic structure, crystal structures from X-ray diffraction. The report then discusses emerging research opportunities

Nano structured materials studied by coherent X-ray diffraction

International Nuclear Information System (INIS)

Gulden, Johannes

2013-03-01

Structure determination with X-rays in crystallography is a rapidly evolving field. Crystallographic methods for structure determination are based on the assumptions about the crystallinity of the sample. It is vital to understand the structure of possible defects in the crystal, because they can influence the structure determination. All conventional methods to characterize defects require a modelling through simulated data. No direct methods exist to image the core of defects in crystals. Here a new method is proposed, which will enable to visualize the individual scatterers around and at defects in crystals. The method is based on coherent X-ray scattering. X-rays are perfectly suited since they can penetrate thick samples and buried structures can be investigated Recent developments increased the coherent flux of X-Ray sources such as synchrotrons by orders of magnitude. As a result, the use of the coherent properties of X-rays is emerging as a new aspect of X-ray science. New upcoming and operating X-ray laser sources will accelerate this trend. One new method which has the capacity to recover structural information from the coherently scattered photons is Coherent X-ray Diffraction Imaging (CXDI). The main focus of this thesis is the investigation of the structure and the dynamics of colloidal crystals. Colloidal crystals can be used as a model for atomic crystals in order to understand the growth and defect structure. Despite the large interest in these structures, many details are still unknown.Therefore, it is vital to develop new approaches to measure the core of defects in colloidal crystals. After an introduction into the basics of the field of coherent X-ray scattering, this thesis introduces a novel method, Small Angle Bragg Coherent Diffractive Imaging, (SAB-CDI). This new measurement technique which besides the relevance to colloidal crystals can be applied to a large variety of nano structured materials. To verify the experimental possibilities the

Nano structured materials studied by coherent X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Gulden, Johannes

2013-03-15

Structure determination with X-rays in crystallography is a rapidly evolving field. Crystallographic methods for structure determination are based on the assumptions about the crystallinity of the sample. It is vital to understand the structure of possible defects in the crystal, because they can influence the structure determination. All conventional methods to characterize defects require a modelling through simulated data. No direct methods exist to image the core of defects in crystals. Here a new method is proposed, which will enable to visualize the individual scatterers around and at defects in crystals. The method is based on coherent X-ray scattering. X-rays are perfectly suited since they can penetrate thick samples and buried structures can be investigated Recent developments increased the coherent flux of X-Ray sources such as synchrotrons by orders of magnitude. As a result, the use of the coherent properties of X-rays is emerging as a new aspect of X-ray science. New upcoming and operating X-ray laser sources will accelerate this trend. One new method which has the capacity to recover structural information from the coherently scattered photons is Coherent X-ray Diffraction Imaging (CXDI). The main focus of this thesis is the investigation of the structure and the dynamics of colloidal crystals. Colloidal crystals can be used as a model for atomic crystals in order to understand the growth and defect structure. Despite the large interest in these structures, many details are still unknown.Therefore, it is vital to develop new approaches to measure the core of defects in colloidal crystals. After an introduction into the basics of the field of coherent X-ray scattering, this thesis introduces a novel method, Small Angle Bragg Coherent Diffractive Imaging, (SAB-CDI). This new measurement technique which besides the relevance to colloidal crystals can be applied to a large variety of nano structured materials. To verify the experimental possibilities the

Time-resolved X-ray studies using third generation synchrotron radiation sources

International Nuclear Information System (INIS)

Mills, D.M.

1991-10-01

The third generation, high-brilliance, hard x-ray, synchrotron radiation (SR) sources currently under construction (ESRF at Grenoble, France; APS at Argonne, Illinois; and SPring-8 at Harima, Japan) will usher in a new era of x-ray experimentation for both physical and biological sciences. One of the most exciting areas of experimentation will be the extension of x-ray scattering and diffraction techniques to the study of transient or time-evolving systems. The high repetition rate, short-pulse duration, high brilliance, and variable spectral bandwidth of these sources make them ideal for x-ray time-resolved studies. The temporal properties (bunch length, interpulse period, etc.) of these new sources will be summarized. Finally, the scientific potential and the technological challenges of time-resolved x-ray scattering from these new sources will be described. 13 refs., 4 figs

A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

Energy Technology Data Exchange (ETDEWEB)

Murray, Thomas D. [University of California, Berkeley, CA 94720 (United States); Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); Lyubimov, Artem Y. [Stanford University, Stanford, CA 94305 (United States); Ogata, Craig M. [Argonne National Laboratory, Argonne, IL 60439 (United States); Vo, Huy [Johns Hopkins University, Baltimore, MD 21205 (United States); Uervirojnangkoorn, Monarin; Brunger, Axel T., E-mail: brunger@stanford.edu [Stanford University, Stanford, CA 94305 (United States); Berger, James M., E-mail: brunger@stanford.edu [Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); University of California, Berkeley, CA 94720 (United States)

2015-09-26

A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs.

A high-transparency, micro-patternable chip for X-ray diffraction analysis of microcrystals under native growth conditions

International Nuclear Information System (INIS)

Murray, Thomas D.; Lyubimov, Artem Y.; Ogata, Craig M.; Vo, Huy; Uervirojnangkoorn, Monarin; Brunger, Axel T.; Berger, James M.

2015-01-01

A highly X-ray-transparent, silicon nitride-based device has been designed and fabricated to harvest protein microcrystals for high-resolution X-ray diffraction data collection using microfocus beamlines and XFELs. Microcrystals present a significant impediment to the determination of macromolecular structures by X-ray diffraction methods. Although microfocus synchrotron beamlines and X-ray free-electron lasers (XFELs) can enable the collection of interpretable diffraction data from microcrystals, there is a need for efficient methods of harvesting small volumes (<2 µl) of microcrystals grown under common laboratory formats and delivering them to an X-ray beam source under native growth conditions. One approach that shows promise in overcoming the challenges intrinsic to microcrystal analysis is to pair so-called ‘fixed-target’ sample-delivery devices with microbeam-based X-ray diffraction methods. However, to record weak diffraction patterns it is necessary to fabricate devices from X-ray-transparent materials that minimize background scattering. Presented here is the design of a new micro-diffraction device consisting of three layers fabricated from silicon nitride, photoresist and polyimide film. The chip features low X-ray scattering and X-ray absorption properties, and uses a customizable blend of hydrophobic and hydrophilic surface patterns to help localize microcrystals to defined regions. Microcrystals in their native growth conditions can be loaded into the chips with a standard pipette, allowing data collection at room temperature. Diffraction data collected from hen egg-white lysozyme microcrystals (10–15 µm) loaded into the chips yielded a complete, high-resolution (<1.6 Å) data set sufficient to determine a high-quality structure by molecular replacement. The features of the chip allow the rapid and user-friendly analysis of microcrystals grown under virtually any laboratory format at microfocus synchrotron beamlines and XFELs

A three-dimensional X-ray diffraction microscope for deformation studies of polycrystals

DEFF Research Database (Denmark)

Fæster Nielsen, Søren; Lauridsen, E.M.; Juul Jensen, D.

2001-01-01

-dimensional X-ray diffraction (3DXRD) microscope installed at the European Synchrotron Radiation Facility in Grenoble provides a fast and non-destructive technique for mapping the embedded grains within thick samples in three dimensions. All essential features like the position, volume, orientation, stress...

Observation of sagittal X-ray diffraction by surface acoustic waves in Bragg geometry.

Science.gov (United States)

Vadilonga, Simone; Zizak, Ivo; Roshchupkin, Dmitry; Evgenii, Emelin; Petsiuk, Andrei; Leitenberger, Wolfram; Erko, Alexei

2017-04-01

X-ray Bragg diffraction in sagittal geometry on a Y-cut langasite crystal (La 3 Ga 5 SiO 14 ) modulated by Λ = 3 µm Rayleigh surface acoustic waves was studied at the BESSY II synchrotron radiation facility. Owing to the crystal lattice modulation by the surface acoustic wave diffraction, satellites appear. Their intensity and angular separation depend on the amplitude and wavelength of the ultrasonic superlattice. Experimental results are compared with the corresponding theoretical model that exploits the kinematical diffraction theory. This experiment shows that the propagation of the surface acoustic waves creates a dynamical diffraction grating on the crystal surface, and this can be used for space-time modulation of an X-ray beam.

New synchrotron powder diffraction facility for long-duration experiments.

Science.gov (United States)

Murray, Claire A; Potter, Jonathan; Day, Sarah J; Baker, Annabelle R; Thompson, Stephen P; Kelly, Jon; Morris, Christopher G; Yang, Sihai; Tang, Chiu C

2017-02-01

A new synchrotron X-ray powder diffraction instrument has been built and commissioned for long-duration experiments on beamline I11 at Diamond Light Source. The concept is unique, with design features to house multiple experiments running in parallel, in particular with specific stages for sample environments to study slow kinetic systems or processes. The instrument benefits from a high-brightness X-ray beam and a large area detector. Diffraction data from the commissioning work have shown that the objectives and criteria are met. Supported by two case studies, the results from months of measurements have demonstrated the viability of this large-scale instrument, which is the world's first dedicated facility for long-term studies (weeks to years) using synchrotron radiation.

Synchrotron x-ray diffraction studies of the structural properties of electrode materials in operating battery cells

International Nuclear Information System (INIS)

Thurston, T.R.; Jisrawi, N.M.; Mukerjee, S.; Yang, X.Q.; McBreen, J.; Daroux, M.L.; Xing, X.K.

1996-01-01

Hard x rays from a synchrotron source were utilized in diffraction experiments which probed the bulk of electrode materials while they were operating in situ in battery cells. Two technologically relevant electrode materials were examined; an AB 2 -type anode in a nickel endash metal endash hydride cell and a LiMn 2 O 4 cathode in a Li-ion open-quote open-quote rocking chair close-quote close-quote cell. Structural features such as lattice expansions and contractions, phase transitions, and the formation of multiple phases were easily observed as either hydrogen or lithium was electrochemically intercalated in and out of the electrode materials. The relevance of this technique for future studies of battery electrode materials is discussed. copyright 1996 American Institute of Physics

In situ laser heating and radial synchrotron X-ray diffraction ina diamond anvil cell

Energy Technology Data Exchange (ETDEWEB)

Kunz, Martin; Caldwell, Wendel A.; Miyagi, Lowell; Wenk,Hans-Rudolf

2007-06-29

We report a first combination of diamond anvil cell radialx-ray diffraction with in situ laser heating. The laser-heating setup ofALS beamline 12.2.2 was modified to allow one-sided heating of a samplein a diamond anvil cell with an 80 W yttrium lithium fluoride laser whileprobing the sample with radial x-ray diffraction. The diamond anvil cellis placed with its compressional axis vertical, and perpendicular to thebeam. The laser beam is focused onto the sample from the top while thesample is probed with hard x-rays through an x-ray transparentboron-epoxy gasket. The temperature response of preferred orientation of(Fe,Mg)O is probed as a test experiment. Recrystallization was observedabove 1500 K, accompanied by a decrease in stress.

In situ thermal residual stress evolution in ultrathin ZnO and Ag films studied by synchrotron x-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Renault, P.O., E-mail: Pierre.olivier.renault@univ-poitiers.fr [Institut P' , CNRS, Universite de Poitiers, UPR 3346, 86962 Futuroscope (France); Krauss, C.; Le Bourhis, E.; Geandier, G. [Institut P' , CNRS, Universite de Poitiers, UPR 3346, 86962 Futuroscope (France); Benedetto, A. [Saint-Gobain Recherche (SGR), 93303 Aubervilliers (France); Grachev, S.Y.; Barthel, E. [Lab. Surface du Verre et Interfaces (SVI), UMR-CNRS 125, 93303 Aubervilliers (France)

2011-12-30

Residual-stress evolution in sputtered encapsulated ZnO/Ag/ZnO stack has been studied in-situ by synchrotron x-ray diffraction when heat treated. The ZnO/Ag/ZnO stack encapsulated into Si{sub 3}N{sub 4} layers and deposited on (001) Si substrates was thermally heated from 25 Degree-Sign C to 600 Degree-Sign C and cooled down to 25 Degree-Sign C. X-ray diffraction 2D patterns captured continuously during the heat treatment allowed monitoring the diffraction peak shifts of both Ag (15 nm thick) and ZnO (10 nm and 50 nm thick) sublayers. Due to the mismatch between the coefficients of thermal expansion, the silicon substrate induced compressive thermal stresses in the films during heating. We first observed a linear increase of the compressive stress state in both Ag and ZnO films and then a more complex elastic-stress evolution starts to operate from about 100 Degree-Sign C for Ag and about 250 Degree-Sign C for ZnO. Thermal contraction upon cooling seems to dominate so that the initial compressive film stresses relax by about 300 and 700 MPa after thermal treatment for ZnO and Ag, respectively. The overall behavior is discussed in terms of structural changes induced by the heat treatment.

Two-dimensional x-ray diffraction

CERN Document Server

He, Bob B

2009-01-01

Written by one of the pioneers of 2D X-Ray Diffraction, this useful guide covers the fundamentals, experimental methods and applications of two-dimensional x-ray diffraction, including geometry convention, x-ray source and optics, two-dimensional detectors, diffraction data interpretation, and configurations for various applications, such as phase identification, texture, stress, microstructure analysis, crystallinity, thin film analysis and combinatorial screening. Experimental examples in materials research, pharmaceuticals, and forensics are also given. This presents a key resource to resea

Sample cell for in-field X-ray diffraction experiments

Directory of Open Access Journals (Sweden)

Viktor Höglin

2015-01-01

Full Text Available A sample cell making it possible to perform synchrotron radiation X-ray powder diffraction experiments in a magnetic field of 0.35 T has been constructed. The device is an add-on to an existing sample cell and contains a strong permanent magnet of NdFeB-type. Experiments have shown that the setup is working satisfactory making it possible to perform in-field measurements.

Preliminary study on X-ray phase contrast imaging using synchrotron radiation facility

International Nuclear Information System (INIS)

Xiong Zhuang; Wang Jianhua; Yu Yongqiang; Jiang Shiping; Chen Yang; Tian Yulian

2006-01-01

Objective: To study the methodology of X-ray phase contrast imaging using synchrotron radiation, and evaluate the quality of phase contrast images. Methods: Several experiments to obtain phase contrast images and absorption contrast images of various biological samples were conducted in Beijing Synchrotron Radiation Facility (BSRF), and then these images were interpreted to find out the difference between the two kinds of imaging methods. Results: Satisfactory phase contrast images of these various samples were obtained, and the quality of these images was superior to that obtained with absorption contrast imaging. The phase contrast formation is based on the phenomenon of fresnel diffraction which transforms phase shifts into intensity variations upon a simple act of free-space propagation, so it requires highly coherent X-rays and appropriate distance between sample and detector. This method of imaging is very useful in imaging of low-absorption objects or objects with little absorption variation, and its resolution is far higher than that of the conventional X-ray imaging. The photographs obtained showed very fine inner microstructure of the biological samples, and the smallest microstructure to be distinguished is within 30-40 μm. There is no doubt that phase contrast imaging has a practical applicability in medicine. Moreover, it improves greatly the efficiency and the resolution of the existing X-ray diagnostic techniques. Conclusions: X-ray phase contrast imaging can be performed with synchrotron radiation source and has some advantages over the conventional absorption contrast imaging. (authors)

Advances in martensitic transformations in Cu-based shape memory alloys achieved by in situ neutron and synchrotron X-ray diffraction methods

Czech Academy of Sciences Publication Activity Database

Malard, B.; Šittner, Petr; Berveiller, S.; Patoor, E.

2012-01-01

Roč. 13, č. 3 (2012), s. 280-292 ISSN 1631-0705 R&D Projects: GA ČR GAP108/10/1296; GA ČR GAP107/12/0800 EU Projects: European Commission(XE) 262806 - SmartNets Institutional research plan: CEZ:AV0Z10100520 Keywords : stress induced martensitic transformation * Cu-based shape memory alloys * neutron diffraction * X-ray * synchrotron * in situ * multiscale analysis Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.818, year: 2012

Hard x-ray monochromator with milli-electron volt bandwidth for high-resolution diffraction studies of diamond crystals

Energy Technology Data Exchange (ETDEWEB)

Stoupin, Stanislav; Shvyd' ko, Yuri; Shu Deming; Khachatryan, Ruben; Xiao, Xianghui; DeCarlo, Francesco; Goetze, Kurt; Roberts, Timothy; Roehrig, Christian; Deriy, Alexey [Advanced Photon Source, Argonne National Laboratory, Illinois 60439 (United States)

2012-02-15

We report on design and performance of a high-resolution x-ray monochromator with a spectral bandwidth of {Delta}E{sub X}{approx_equal} 1.5 meV, which operates at x-ray energies in the vicinity of the backscattering (Bragg) energy E{sub H} = 13.903 keV of the (008) reflection in diamond. The monochromator is utilized for high-energy-resolution diffraction characterization of diamond crystals as elements of advanced x-ray crystal optics for synchrotrons and x-ray free-electron lasers. The monochromator and the related controls are made portable such that they can be installed and operated at any appropriate synchrotron beamline equipped with a pre-monochromator.

Synchrotron diffraction characterization of nanostructured KY3F10:Tb

International Nuclear Information System (INIS)

Ichikawa, Rodrigo U.; Teixeira, Maria I.; Ranieri, Izilda M.; Martinez, Luis G.; Linhares, Horacio M.S.M.D.; Turrillas, Xavier

2015-01-01

Nanostructured rare-earth fluorides materials are being intensively studied recently due to their potential applications in high-dose dosimetry. Particularly, nanostructured Tb-doped KY 3 F 10 has shown satisfactory results to be used in this area. In the present work, the structure and microstructure of KY 3 F 10 :Tb was investigated by means of X-ray synchrotron diffraction. One of the samples was analyzed as synthesized and another after a heat treatment. Rietveld refinement of synchrotron diffraction data was applied to obtain cell parameters, atomic positions and atomic displacement factors and the results were compared to values found in literature. X-ray line profile analysis methods were applied to determine mean crystallite sizes and their distribution. (author)

The epitaxial growth and interfacial strain study of VO{sub 2}/MgF{sub 2} (001) films by synchrotron based grazing incidence X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Fan, L.L. [Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology, Yancheng 224051 (China); National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Chen, S. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Liu, Q.H. [Science and Technology on Electro-optical Information Security Control Laboratory, Tianjin 300300 (China); Liao, G.M.; Chen, Y.L.; Ren, H. [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China); Zou, C.W., E-mail: czou@ustc.edu.cn [National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029 (China)

2016-09-05

High quality VO{sub 2} films with different thickness were epitaxially grown on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. The evolution of interfacial strain was investigated by synchrotron based grazing incidence X-ray diffraction. By adjusting the incidence angles, the penetration depth of X-ray in VO{sub 2} film could be controlled and the thickness-depend lattice distortion in the epitaxial VO{sub 2} film was investigated. Due to the lattice mismatching, the pronounced tensile strain was observed in ultra-thin VO{sub 2} film. As the film thickness increasing, the interfacial strain relaxed gradually and became fully relaxed for thick VO{sub 2} films. Combined with the electric transport measurement, it was revealed that the phase transition temperature of ultra-thin VO{sub 2} film decreased greatly. The effect of interfacial strain induced phase transition modulation and the intrinsic mechanism was systematically discussed. - Highlights: • We prepared high quality VO{sub 2} epitaxial films on MgF{sub 2} (001) substrates by oxide molecular beam epitaxy method. • Synchrotron radiation grazing incidence X-ray diffraction was employed to detect evolution of strain along depth profile. • Based on a classic band structure model, the mechanism of strain controlled phase transition of VO{sub 2} was discussed.

Synchrotron X-ray fluorescence analysis in environmental and earth sciences

Directory of Open Access Journals (Sweden)

Adams F.

2010-12-01

Full Text Available Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 10–20 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed.

X-ray diffraction imaging of material microstructures

KAUST Repository

Varga, Laszlo

2016-10-20

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.

A submicron synchrotron X-ray beam generated by capillary optics

International Nuclear Information System (INIS)

Engstroem, P.; Larsson, S.; Rindby, A.; Buttkewitz, A.; Garbe, S.; Gaul, G.; Knoechel, A.; Lechtenberg, F.; Deutsches Elektronen-Synchrotron

1991-01-01

A novel capillary optics technique for focusing synchrotron X-ray beams has been applied in an experiment performed at the DORIS storage ring at HASYLAB. This new technqiue, which utilizes the total reflection properties of X-rays inside small capillaries, has recently been applied to generate microbeams of X-rays, with a beam size down to about 10 μm using conventional X-ray tubes. The result from our recent experiment shows that capillary optics can also be used to generate a submicron beam of X-rays from a synchrotron light source. A description of the capillary unit, and the alignment procedure is given. The influence of the thermal load on the device caused by the intense flux of synchrotron radiation will be discussed. Future perspectives of the capillary techniques as applied to synchrotron radiation will be discussed. (orig.)

Advances in indirect detector systems for ultra high-speed hard X-ray imaging with synchrotron light

Science.gov (United States)

Olbinado, M. P.; Grenzer, J.; Pradel, P.; De Resseguier, T.; Vagovic, P.; Zdora, M.-C.; Guzenko, V. A.; David, C.; Rack, A.

2018-04-01

We report on indirect X-ray detector systems for various full-field, ultra high-speed X-ray imaging methodologies, such as X-ray phase-contrast radiography, diffraction topography, grating interferometry and speckle-based imaging performed at the hard X-ray imaging beamline ID19 of the European Synchrotron—ESRF. Our work highlights the versatility of indirect X-ray detectors to multiple goals such as single synchrotron pulse isolation, multiple-frame recording up to millions frames per second, high efficiency, and high spatial resolution. Besides the technical advancements, potential applications are briefly introduced and discussed.

Synchrotron X-ray induced solution precipitation of nanoparticles

CERN Document Server

Lee, H J; Hwu, Y; Tsai, W L

2003-01-01

By irradiating a solution in electroless Ni deposition using synchrotron X-rays, Ni composite was found to nucleate homogeneously and eventually precipitate in the form of nanoparticles. The size of the nanoparticles precipitated is rather uniform (100-300 nm depending on the applied temperature). By the addition of an organic acid, well-dispersed nanoparticles could be effectively deposited on glass substrate. The hydrated electrons (e sub a sub q sup -), products of radiolysis of water molecules by synchrotron X-rays, may be responsible for the effective reduction of the metal ions, resulting in homogeneous nucleation and nanoparticle formation. Our results suggest that synchrotron X-ray can be used to induce solution precipitation of nanoparticles and therefore lead to a new method of producing nanostructured particles and coating.

X-ray energy-dispersive diffractometry using synchrotron radiation

International Nuclear Information System (INIS)

Buras, B.; Staun Olsen, J.; Gerward, L.

1977-03-01

In contrast to bremsstrahlung from X-ray tubes, synchrotron radiation is very intense, has a smooth spectrum, its polarization is well defined, and at DESY the range of useful photon energies can be extended to about 70 keV and higher. In addition the X-ray beam is very well collimated. Thus synchrotron radiation seems to be an ideal X-ray source for energy-dispersive diffractometry. This note briefly describes the experimental set up at DESY, shows examples of results, and presents the underlying 'philosophy' of the research programme. (Auth.)

Evaluating scintillator performance in time-resolved hard X-ray studies at synchrotron light sources

International Nuclear Information System (INIS)

Rutherford, Michael E.; Chapman, David J.; White, Thomas G.; Drakopoulos, Michael; Rack, Alexander; Eakins, Daniel E.

2016-01-01

Scintillator performance in time-resolved, hard, indirect detection X-ray studies on the sub-microsecond timescale at synchrotron light sources is reviewed, modelled and examined experimentally. LYSO:Ce is found to be the only commercially available crystal suitable for these experiments. The short pulse duration, small effective source size and high flux of synchrotron radiation is ideally suited for probing a wide range of transient deformation processes in materials under extreme conditions. In this paper, the challenges of high-resolution time-resolved indirect X-ray detection are reviewed in the context of dynamic synchrotron experiments. In particular, the discussion is targeted at two-dimensional integrating detector methods, such as those focused on dynamic radiography and diffraction experiments. The response of a scintillator to periodic synchrotron X-ray excitation is modelled and validated against experimental data collected at the Diamond Light Source (DLS) and European Synchrotron Radiation Facility (ESRF). An upper bound on the dynamic range accessible in a time-resolved experiment for a given bunch separation is calculated for a range of scintillators. New bunch structures are suggested for DLS and ESRF using the highest-performing commercially available crystal LYSO:Ce, allowing time-resolved experiments with an interframe time of 189 ns and a maximum dynamic range of 98 (6.6 bits)

Evaluating scintillator performance in time-resolved hard X-ray studies at synchrotron light sources

Energy Technology Data Exchange (ETDEWEB)

Rutherford, Michael E.; Chapman, David J.; White, Thomas G. [Imperial College London, London (United Kingdom); Drakopoulos, Michael [Diamond Light Source, I12 Joint Engineering, Environmental, Processing (JEEP) Beamline, Didcot, Oxfordshire (United Kingdom); Rack, Alexander [European Synchrotron Radiation Facility, Grenoble (France); Eakins, Daniel E., E-mail: d.eakins@imperial.ac.uk [Imperial College London, London (United Kingdom)

2016-03-24

Scintillator performance in time-resolved, hard, indirect detection X-ray studies on the sub-microsecond timescale at synchrotron light sources is reviewed, modelled and examined experimentally. LYSO:Ce is found to be the only commercially available crystal suitable for these experiments. The short pulse duration, small effective source size and high flux of synchrotron radiation is ideally suited for probing a wide range of transient deformation processes in materials under extreme conditions. In this paper, the challenges of high-resolution time-resolved indirect X-ray detection are reviewed in the context of dynamic synchrotron experiments. In particular, the discussion is targeted at two-dimensional integrating detector methods, such as those focused on dynamic radiography and diffraction experiments. The response of a scintillator to periodic synchrotron X-ray excitation is modelled and validated against experimental data collected at the Diamond Light Source (DLS) and European Synchrotron Radiation Facility (ESRF). An upper bound on the dynamic range accessible in a time-resolved experiment for a given bunch separation is calculated for a range of scintillators. New bunch structures are suggested for DLS and ESRF using the highest-performing commercially available crystal LYSO:Ce, allowing time-resolved experiments with an interframe time of 189 ns and a maximum dynamic range of 98 (6.6 bits)

High-intensity laser synchrotron x-ray source

International Nuclear Information System (INIS)

Pogorelsky, I.V.

1995-10-01

A laser interacting with a relativistic electron beam behaves like a virtual wiggler of an extremely short period equal to half of the laser wavelength. This approach opens a route to relatively compact, high-brightness x-ray sources alternative or complementary to conventional synchrotron light sources. Although not new, the Laser Synchrotron Light Source (LSLS) concept is still waiting for a convincing demonstration. Available at the BNL's Accelerator Test Facility (ATF), a high-brightness electron beam and the high-power C0 2 laser may be used as prototype LSLS brick stones. In a feasible demonstration experiment, 10-GW, 100-ps C0 2 laser beam will be brought to a head-on collision with a 10-ps, 0.5-nC, 70 MeV electron bunch. Flashes of well-collimated, up to 9.36-keV (∼ Angstrom) x-rays of 10-ps pulse duration, with a flux of ∼10 19 photons/sec will be produced via linear Compton backscattering. The x-ray spectrum is tunable proportionally to a variable e-beam energy. A natural short-term extension of the proposed experiment would be further enhancement of the x-ray flux to a 10 21 -10 22 photons/sec level, after the ongoing ATF CO 2 laser upgrade to 1 TW peak power and electron bunch shortening to 3 ps. The ATF LSLS x-ray beamline, exceeding by orders of magnitude the peak fluxes attained at the National Synchrotron Light Source (NSLS) x-ray storage ring, may become attractive for certain users, e.g., for biological x-ray microscopy. In addition, a terawatt CO 2 laser will enable harmonic multiplication of the x-ray spectrum via nonlinear Compton scattering

A novel technique combining high-resolution synchrotron x-ray microtomography and x-ray diffraction for characterization of micro particulates

International Nuclear Information System (INIS)

Merrifield, David R; Ramachandran, Vasuki; Roberts, Kevin J; Armour, Wesley; Axford, Danny; Basham, Mark; Connolley, Thomas; Evans, Gwyndaf; McAuley, Katherine E; Owen, Robin L; Sandy, James

2011-01-01

The processing of solids, such as crystals, is strongly influenced by the surface properties of the material. In recent years the pharmaceutical industry has shown great interest in identifying, or chemically speciating, the molecular components of crystal faces. Formerly, characterization of the molecular identity of crystal faces was restricted to the study of large single crystals. This would have been primarily for structure determination as part of the drug registration process. Diamond Light Source in Oxfordshire is a new synchrotron facility in the UK, having 18 operational beamlines with 4 more in the construction phase. Beamlines at this medium energy light source enable the study of micron-sized objects in great detail. It is well known that x-ray microtomography (XMT) can be used to investigate the external morphology of a crystal whereas x-ray diffraction (XRD) is used to study the molecular orientation, structure and packing within the crystal. The objective of this research is to assess the feasibility of, and thereby develop a new methodology for, characterizing the molecular identity of a particular face of a crystalline particle at a scale of scrutiny of 20–50 µm by combining these two powerful techniques. This work demonstrates the application of XMT and XRD to investigate respectively the shape and crystalline phase/orientation of relevant test crystals. This research has applications in the pharmaceutical industry in that when the exact molecular nature of a particular face is known, the important physico-pharmaceutical properties stemming from that can be better understood. Some initial data are presented and discussed

In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x-ray fluorescence and diffraction

International Nuclear Information System (INIS)

Mainz, R.; Klenk, R.

2011-01-01

In this work we present a method for the in situ analysis of elemental depth distributions in thin films using a combined evaluation of synchrotron x-ray fluorescence and energy-dispersive x-ray diffraction signals. We recorded diffraction and fluorescence signals simultaneously during the reactive annealing of thin films. By means of the observed diffraction signals, the time evolution of phases in the thin films during the annealing processes can be determined. We utilized this phase information to parameterize the depth distributions of the elements in the films. The time-dependent fluorescence signals were then taken to determine the parameters representing the parameterized depth distributions. For this latter step, we numerically calculated the fluorescence intensities for a given set of depth distributions. These calculations handle polychromatic excitation and arbitrary functions of depth distributions and take into account primary and secondary fluorescence. Influences of lateral non-uniformities of the films, as well as the accuracy limits of the method, are investigated. We apply the introduced method to analyze the evolution of elemental depth distributions and to quantify the kinetic parameters during a synthesis process of CuInS 2 thin films via the reactive annealing of Cu-In precursors in a sulfur atmosphere.

Crystal and magnetic structure of the Ca3Mn2O7 Ruddlesden-Popper phase: neutron and synchrotron x-ray diffraction study

International Nuclear Information System (INIS)

Lobanov, Maxim V; Greenblatt, Martha; Caspi, El'ad N; Jorgensen, James D; Sheptyakov, Denis V; Toby, Brian H; Botez, Cristian E; Stephens, Peter W

2004-01-01

The crystallographic and magnetic structures of Ca 3 Mn 2 O 7 Ruddlesden-Popper phase have been determined by a combination of neutron and synchrotron x-ray diffraction. Two-phase behaviour observed at room temperature is attributed to an incomplete structural phase transition. The magnetic structure was solved in the Cm'c2 1 ' Shubnikov group with dominant G-type antiferromagnetic order in the perovskite bilayers. The temperature evolution of the structural and magnetic parameters is presented

Combined X-ray and neutron fibre diffraction studies of biological and synthetic polymers

International Nuclear Information System (INIS)

Parrot, I.M.; Urban, V.; Gardner, K.H.; Forsyth, V.T.

2005-01-01

The fibrous state is a natural one for polymer molecules which tend to assume regular helical conformations rather than the globular structures characteristic of many proteins. Fibre diffraction therefore has broad application to the study of a wide range of biological and synthetic polymers. The purpose of this paper is to illustrate the general scope of the method and in particular to demonstrate the impact of a combined approach involving both X-ray and neutron diffraction methods. While the flux of modern X-ray synchrotron radiation sources allows high quality datasets to be recorded with good resolution within a very short space of time, neutron studies can provide unique information through the ability to locate hydrogen or deuterium atoms that are often difficult or impossible to locate using X-ray methods. Furthermore, neutron fibre diffraction methods can, through the ability to selectively label specific parts of a structure, be used to highlight novel aspects of polymer structure that can not be studied using X-rays. Two examples are given. The first describes X-ray and neutron diffraction studies of conformational transitions in DNA. The second describes structural studies of the synthetic high-performance polymer poly(p-phenylene terephthalamide) (PPTA), known commercially as Kevlar[reg] or Twaron[reg

Combined X-ray and neutron fibre diffraction studies of biological and synthetic polymers.

Energy Technology Data Exchange (ETDEWEB)

Parrot, I. M. [Institut Laue-Langevin (ILL); Urban, Volker S [ORNL; Gardner, K. H. [DuPont Experimental Station; Forsyth, V. T. [Institut Laue Langevin and Keele University

2005-04-01

The fibrous state is a natural one for polymer molecules which tend to assume regular helical conformations rather than the globular structures characteristic of many proteins. Fibre diffraction therefore has broad application to the study of a wide range of biological and synthetic polymers. The purpose of this paper is to illustrate the general scope of the method and in particular to demonstrate the impact of a combined approach involving both X-ray and neutron diffraction methods. While the flux of modern X-ray synchrotron radiation sources allows high quality datasets to be recorded with good resolution within a very short space of time, neutron studies can provide unique information through the ability to locate hydrogen or deuterium atoms that are often difficult or impossible to locate using X-ray methods. Furthermore, neutron fibre diffraction methods can, through the ability to selectively label specific parts of a structure, be used to highlight novel aspects of polymer structure that can not be studied using X-rays. Two examples are given. The first describes X-ray and neutron diffraction studies of conformational transitions in DNA. The second describes structural studies of the synthetic high-performance polymer poly(p-phenylene terephthalamide) (PPTA), known commercially as Kevlar{reg_sign} or Twaron{reg_sign}.

Combined X-ray and neutron fibre diffraction studies of biological and synthetic polymers

Science.gov (United States)

Parrot, I. M.; Urban, V.; Gardner, K. H.; Forsyth, V. T.

2005-08-01

The fibrous state is a natural one for polymer molecules which tend to assume regular helical conformations rather than the globular structures characteristic of many proteins. Fibre diffraction therefore has broad application to the study of a wide range of biological and synthetic polymers. The purpose of this paper is to illustrate the general scope of the method and in particular to demonstrate the impact of a combined approach involving both X-ray and neutron diffraction methods. While the flux of modern X-ray synchrotron radiation sources allows high quality datasets to be recorded with good resolution within a very short space of time, neutron studies can provide unique information through the ability to locate hydrogen or deuterium atoms that are often difficult or impossible to locate using X-ray methods. Furthermore, neutron fibre diffraction methods can, through the ability to selectively label specific parts of a structure, be used to highlight novel aspects of polymer structure that can not be studied using X-rays. Two examples are given. The first describes X-ray and neutron diffraction studies of conformational transitions in DNA. The second describes structural studies of the synthetic high-performance polymer poly(p-phenylene terephthalamide) (PPTA), known commercially as Kevlar® or Twaron®.

Combined X-ray and neutron fibre diffraction studies of biological and synthetic polymers

Energy Technology Data Exchange (ETDEWEB)

Parrot, I.M. [Institut Laue Langevin, 6 Rue Jules Horowitz, 38042 Grenoble Cedex 9 (France); Institute of Science and Technology in Medicine, Keele University Medical School, Staffordshire ST4 7QB (United Kingdom); Urban, V. [Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831-6100 (United States); Gardner, K.H. [Department of Materials Science and Engineering University of Delaware, Newark, DE 19719 (United States); Forsyth, V.T. [Institut Laue Langevin, 6 Rue Jules Horowitz, 38042 Grenoble Cedex 9 (France) and Institute of Science and Technology in Medicine, Keele University Medical School, Staffordshire ST4 7QB (United Kingdom)]. E-mail: tforsyth@ill.fr

2005-08-15

The fibrous state is a natural one for polymer molecules which tend to assume regular helical conformations rather than the globular structures characteristic of many proteins. Fibre diffraction therefore has broad application to the study of a wide range of biological and synthetic polymers. The purpose of this paper is to illustrate the general scope of the method and in particular to demonstrate the impact of a combined approach involving both X-ray and neutron diffraction methods. While the flux of modern X-ray synchrotron radiation sources allows high quality datasets to be recorded with good resolution within a very short space of time, neutron studies can provide unique information through the ability to locate hydrogen or deuterium atoms that are often difficult or impossible to locate using X-ray methods. Furthermore, neutron fibre diffraction methods can, through the ability to selectively label specific parts of a structure, be used to highlight novel aspects of polymer structure that can not be studied using X-rays. Two examples are given. The first describes X-ray and neutron diffraction studies of conformational transitions in DNA. The second describes structural studies of the synthetic high-performance polymer poly(p-phenylene terephthalamide) (PPTA), known commercially as Kevlar[reg] or Twaron[reg].

In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

Energy Technology Data Exchange (ETDEWEB)

Davydok, A., E-mail: davydok@mpie.de [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France); Max-Planck-Institut für Eisenforschung, Department Structure and Nano-/Micromechanics of Materials, D-40237 Düsseldorf (Germany); Cornelius, T.W. [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France); Mocuta, C. [SOLEIL Synchrotron, DiffAbs beamline, L' Orme des Merisiers, Saint-Aubin - BP 48, 91192 Gif-sur-Yvette Cedex (France); Lima, E.C. [Universidade Federal do Tocantins, 77500-000 Porto Nacional, TO (Brazil); Araujo, E.B. [Departamento de Fisica e Quimica, Universidade Estadual Paulista, Av. Brasil, 56 Centro, 15385-000 Ilha Solteira, SP (Brazil); Thomas, O. [Aix Marseille Université, CNRS, Université de Toulon, IM2NP UMR 7334, 13397 Marseille (France)

2016-03-31

Piezoelectric properties of randomly oriented self-polarized PbZr{sub 0.50}Ti{sub 0.50}O{sub 3} (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using micro-sized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d{sub 33} was calculated in terms of the lab reference frame (d{sub perp}) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the d{sub perp} amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. - Highlights: • We performed in situ synchrotron X-ray diffraction studies on (PZT) thin films. • We discuss anisotropy of piezo effect in different crystallographic directions. • Perpendicular component Piezo coefficient of thin PZT layer is defined.

Combining X-ray Absorption and X-ray Diffraction Techniques for in Situ Studies of Chemical Transformations in Heterogeneous Catalysis: Advantages and Limitations

International Nuclear Information System (INIS)

Frenkel, A.I.; Hanson, J.; Wang, Q.; Marinkovic, N.; Chen, J.G.; Barrio, L.; Si, R.; Lopez Camara, A.; Estrella, A.M.; Rodriguez, J.A.

2011-01-01

Recent advances in catalysis instrumentations include synchrotron-based facilities where time-resolved X-ray scattering and absorption techniques are combined in the same in situ or operando experiment to study catalysts at work. To evaluate the advances and limitations of this method, we performed a series of experiments at the new XAFS/XRD instrument in the National Synchrotron Light Source. Nearly simultaneous X-ray diffraction (XRD) and X-ray absorption fine-structure (XAFS) measurements of structure and kinetics of several catalysts under reducing or oxidizing conditions have been performed and carefully analyzed. For CuFe 2 O 4 under reducing conditions, the combined use of the two techniques allowed us to obtain accurate data on kinetics of nucleation and growth of metallic Cu. For the inverse catalyst CuO/CeO 2 that underwent isothermal reduction (with CO) and oxidation (with O 2 ), the XAFS data measured in the same experiment with XRD revealed strongly disordered Cu species that went undetected by diffraction. These and other examples emphasize the unique sensitivity of these two complementary methods to follow catalytic processes in the broad ranges of length and time scales.

High-pressure X-ray diffraction studies of potassium chlorate

Energy Technology Data Exchange (ETDEWEB)

Pravica, Michael; Bai, Ligang; Bhattacharya, Neelanjan (UNLV)

2012-03-15

Two static high-pressure X-ray diffraction (XRD) studies of potassium chlorate have been performed at pressures of up to {approx}14.3 GPa in a diamond anvil cell at ambient temperature using the 16 ID-B undulator beamline at the Advanced Photon Source for the X-ray source. The first experiment was conducted to ascertain decomposition rates of potassium chlorate as a function of pressure. Below 2 GPa, the sample was observed to decompose rapidly in the presence of the X-ray beam and release oxygen. Above 2 GPa (near the phase I phase II transition), the decomposition rate dramatically slowed so that good quality XRD patterns could be acquired. This suggests a phase-dependent decomposition rate. In the second study, X-ray diffraction spectra were collected at pressures from 2 to 14.3 GPa by aligning virgin portions of the sample into the focused X-ray beam at each pressure. The results suggest the co-existence of mixed monoclinic (I) and rhombohedral (II) phases of potassium chlorate near 2 GPa. At pressures beyond 4 GPa, the XRD patterns show a very good fit to KClO{sub 3} in the rhombohedral phase with space group R3m, in agreement with earlier studies. No further phase transitions were observed with pressure. Decompression of the sample to ambient pressure indicated mixed phases I and II coupled with a small amount of synchrotron X-ray-induced decomposition product. The equation of state within this pressure regime has been determined.

Synchrotron x-ray studies of the keel of the short-spined sea urchin lytechinus variegatus: absorption microtomography (microCT) and small beam diffraction mapping

International Nuclear Information System (INIS)

Stock, S.R.; Barss, J.; Dahl, T.; Veis, A.; Almer, J.D.; De Carlo, F.

2003-01-01

In sea urchin teeth, the keel plays an important structural role, and this paper reports results of microstructural characterization of the keel of Lytechinus variegatus using two noninvasive synchrotron x-ray techniques: x-ray absorption microtomography (microCT) and x-ray diffraction mapping. MicroCT with 14 keV x-rays mapped the spatial distribution of mineral at the 1.3 microm level in a millimeter-sized fragment of a mature portion of the keel. Two rows of low absorption channels (i.e., primary channels) slightly less than 10 microm in diameter were found running linearly from the flange to the base of the keel and parallel to its sides. The primary channels paralleled the oral edge of the keel, and the microCT slices revealed a planar secondary channel leading from each primary channel to the side of the keel. The primary and secondary channels were more or less coplanar and may correspond to the soft tissue between plates of the carinar process. Transmission x-ray diffraction with 80.8 keV x-rays and a 0.1 mm beam mapped the distribution of calcite crystal orientations and the composition Ca(1-x)Mg(x)CO(3) of the calcite. Unlike the variable Mg concentration and highly curved prisms found in the keel of Paracentrotus lividus, a constant Mg content (x = 0.13) and relatively little prism curvature was found in the keel of Lytechinus variegatus.

Diamond monochromator for high heat flux synchrotron x-ray beams

International Nuclear Information System (INIS)

Khounsary, A.M.; Smither, R.K.; Davey, S.; Purohit, A.

1992-12-01

Single crystal silicon has been the material of choice for x-ray monochromators for the past several decades. However, the need for suitable monochromators to handle the high heat load of the next generation synchrotron x-ray beams on the one hand and the rapid and on-going advances in synthetic diamond technology on the other make a compelling case for the consideration of a diamond mollochromator system. In this Paper, we consider various aspects, advantage and disadvantages, and promises and pitfalls of such a system and evaluate the comparative an monochromator subjected to the high heat load of the most powerful x-ray beam that will become available in the next few years. The results of experiments performed to evaluate the diffraction properties of a currently available synthetic single crystal diamond are also presented. Fabrication of diamond-based monochromator is within present technical means

Submicron x-ray diffraction and its applications to problems in materials and environmental science

Science.gov (United States)

Tamura, N.; Celestre, R. S.; MacDowell, A. A.; Padmore, H. A.; Spolenak, R.; Valek, B. C.; Meier Chang, N.; Manceau, A.; Patel, J. R.

2002-03-01

The availability of high brilliance third generation synchrotron sources together with progress in achromatic focusing optics allows us to add submicron spatial resolution to the conventional century-old x-ray diffraction technique. The new capabilities include the possibility to map in situ, grain orientations, crystalline phase distribution, and full strain/stress tensors at a very local level, by combining white and monochromatic x-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron x-ray diffraction techniques at the Advanced Light Source, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed.

Submicron X-Ray Diffraction and its Applications to Problems in Materials and Environmental Science

Energy Technology Data Exchange (ETDEWEB)

Patel, J. R.

2002-08-16

The availability of high brilliance 3rd generation synchrotron sources together with progress in achromatic focusing optics allow to add submicron spatial resolution to the conventional century-old X-ray diffraction technique. The new capabilities include the possibility to map in-situ, grain orientations, crystalline phase distribution and full strain/stress tensors at a very local level, by combining white and monochromatic X-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron X-ray diffraction techniques at the ALS, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed.

Submicron X-ray diffraction and its applications to problems in materials and environmental science

Energy Technology Data Exchange (ETDEWEB)

Tamura, N.; Celestre, R.S.; MacDowell, A.A.; Padmore, H.A.; Spolenak, R.; Valek, B.C.; Meier Chang, N.; Manceau, A.; Patel, J.R.

2002-03-26

The availability of high brilliance 3rd generation synchrotron sources together with progress in achromatic focusing optics allow to add submicron spatial resolution to the conventional century-old X-ray diffraction technique. The new capabilities include the possibility to map in-situ, grain orientations, crystalline phase distribution and full strain/stress tensors at a very local level, by combining white and monochromatic X-ray microbeam diffraction. This is particularly relevant for high technology industry where the understanding of material properties at a microstructural level becomes increasingly important. After describing the latest advances in the submicron X-ray diffraction techniques at the ALS, we will give some examples of its application in material science for the measurement of strain/stress in metallic thin films and interconnects. Its use in the field of environmental science will also be discussed.

Quantitative X-ray microtomography with synchrotron radiation

Energy Technology Data Exchange (ETDEWEB)

Donath, T. [GKSS-Forschungszentrum Geesthacht GmbH (Germany). Inst. fuer Materialforschung

2007-07-01

Synchrotron-radiation-based computed microtomography (SR{sub {mu}}CT) is an established method for the examination of volume structures. It allows to measure the x-ray attenuation coefficient of a specimen three-dimensionally with a spatial resolution of about one micrometer. In contrast to conventional x-ray sources (x-ray tubes), the unique properties of synchrotron radiation enable quantitative measurements that do not suffer from beam-hardening artifacts. During this work the capabilities for quantitative SR{sub {mu}}CT measurements have been further improved by enhancements that were made to the SR{sub {mu}}CT apparatus and to the reconstruction chain. For high-resolution SR{sub {mu}}CT an x-ray camera consisting of luminescent screen (x-ray phosphor), lens system, and CCD camera was used. A significant suppression of blur that is caused by reflections inside the luminescent screen could be achieved by application of an absorbing optical coating to the screen surface. It is shown that blur and ring artifacts in the tomographic reconstructions are thereby drastically reduced. Furthermore, a robust and objective method for the determination of the center of rotation in projection data (sinograms) is presented that achieves sub-pixel precision. By implementation of this method into the reconstruction chain, complete automation of the reconstruction process has been achieved. Examples of quantitative SR{sub {mu}}CT studies conducted at the Hamburger Synchrotronstrahlungslabor HASYLAB at the Deutsches Elektronen-Synchrotron DESY are presented and used for the demonstration of the achieved enhancements. (orig.)

Quantitative X-ray microtomography with synchrotron radiation

International Nuclear Information System (INIS)

Donath, T.

2007-01-01

Synchrotron-radiation-based computed microtomography (SR μ CT) is an established method for the examination of volume structures. It allows to measure the x-ray attenuation coefficient of a specimen three-dimensionally with a spatial resolution of about one micrometer. In contrast to conventional x-ray sources (x-ray tubes), the unique properties of synchrotron radiation enable quantitative measurements that do not suffer from beam-hardening artifacts. During this work the capabilities for quantitative SR μ CT measurements have been further improved by enhancements that were made to the SR μ CT apparatus and to the reconstruction chain. For high-resolution SR μ CT an x-ray camera consisting of luminescent screen (x-ray phosphor), lens system, and CCD camera was used. A significant suppression of blur that is caused by reflections inside the luminescent screen could be achieved by application of an absorbing optical coating to the screen surface. It is shown that blur and ring artifacts in the tomographic reconstructions are thereby drastically reduced. Furthermore, a robust and objective method for the determination of the center of rotation in projection data (sinograms) is presented that achieves sub-pixel precision. By implementation of this method into the reconstruction chain, complete automation of the reconstruction process has been achieved. Examples of quantitative SR μ CT studies conducted at the Hamburger Synchrotronstrahlungslabor HASYLAB at the Deutsches Elektronen-Synchrotron DESY are presented and used for the demonstration of the achieved enhancements. (orig.)

X-Ray diffraction studies of silicon implanted with high energy ions

International Nuclear Information System (INIS)

Wieteska, K.; Wierzchowski, W.; Graeff, W.

1998-01-01

The character of lattice deformation in silicon implanted with high energy alpha-particles and protons was studied using a number of X-ray methods. The experiments included double-crystal spectrometer method as well as single crystal section and projection topography realised both with conventional and synchrotron X-ray sources. All observed diffraction patterns were reasonably explainable assuming the lattice parameter distribution proportional to the vacancy-interstitial distribution coming from the Biersack-ziegler theory. The theoretical rocking curves and distribution in back-reflection double-crystal and section topographs well corresponding to the experimental results were calculated using numerical integration of the takagi-taupin equations

Hard synchrotron radiation scattering from a nonideal surface grating from multilayer X-ray mirrors

International Nuclear Information System (INIS)

Punegov, V.I.; Nesterets, Ya.I.; Mytnichenko, S.V.; Kovalenko, N.V.; Chernov, V.A.

2003-01-01

The hard synchrotron radiation scattering from a multilayer surface grating is theoretically and experimentally investigated. The numerical calculations of angular distribution of scattering intensity from X-ray mirror Ni/C are executed with use of recurrence formulae and statistical dynamical theory of diffraction. It is shown, that the essential role in formation of a diffraction pattern plays a diffuse scattering caused by structure imperfection of a multilayer grating [ru

Accommodation stresses in hydride precipitates by synchrotron x-ray diffraction

International Nuclear Information System (INIS)

Santisteban, J R; Vicente, M A; Vizcaino, P; Banchik, A D; Almer, J

2012-01-01

Hydride-forming materials (Zr, Ti, Nb, etc) are affected by a sub-critical crack growth mechanism that involves the diffusion of H to the stressed region ahead of a crack, followed by nucleation and fracture of hydrides at the crack tip [1]. The phenomenon is intermittent, with the crack propagating through the hydride and stopping when it reaches the matrix. By repeating these processes, the crack propagates through a component at a rate that is highly dependent on the temperature history of the component. Most research effort to understand this phenomenon has occurred within the nuclear industry, as it affects the safe operation of pressure tubes (Zr2.5%Nb) and the long-term storage of nuclear fuel (Zircaloy cladding). Stress-induced hydride formation is a consequence of the volume dilatation that accompanies hydride formation (of the order of 15%), which is elastoplastically accommodated by the matrix and precipitate. Compressive stresses are expected within hydride precipitates due to the constraint imposed by the matrix. Such 'accommodation' stresses are essential ingredients in all theoretical models developed to assess the crack growth rate dependence on operational variables such as temperature, applied stress intensity factor, or overall H concentration [2]. Yet little experimental information is available about the magnitude and directionality of such accommodation stresses. Synchrotron X-ray diffraction is the only technique capable of quantifying such stresses. Here we briefly describe the fundaments of the technique, when used through an area detector placed in transmission geometry. The results of the experiments have allowed us to produce a comprehensive picture about the magnitude and origin of accommodation stresses in δ zirconium hydride platelets (author)

An instrument for in situ time-resolved X-ray imaging and diffraction of laser powder bed fusion additive manufacturing processes

Science.gov (United States)

Calta, Nicholas P.; Wang, Jenny; Kiss, Andrew M.; Martin, Aiden A.; Depond, Philip J.; Guss, Gabriel M.; Thampy, Vivek; Fong, Anthony Y.; Weker, Johanna Nelson; Stone, Kevin H.; Tassone, Christopher J.; Kramer, Matthew J.; Toney, Michael F.; Van Buuren, Anthony; Matthews, Manyalibo J.

2018-05-01

In situ X-ray-based measurements of the laser powder bed fusion (LPBF) additive manufacturing process produce unique data for model validation and improved process understanding. Synchrotron X-ray imaging and diffraction provide high resolution, bulk sensitive information with sufficient sampling rates to probe melt pool dynamics as well as phase and microstructure evolution. Here, we describe a laboratory-scale LPBF test bed designed to accommodate diffraction and imaging experiments at a synchrotron X-ray source during LPBF operation. We also present experimental results using Ti-6Al-4V, a widely used aerospace alloy, as a model system. Both imaging and diffraction experiments were carried out at the Stanford Synchrotron Radiation Lightsource. Melt pool dynamics were imaged at frame rates up to 4 kHz with a ˜1.1 μm effective pixel size and revealed the formation of keyhole pores along the melt track due to vapor recoil forces. Diffraction experiments at sampling rates of 1 kHz captured phase evolution and lattice contraction during the rapid cooling present in LPBF within a ˜50 × 100 μm area. We also discuss the utility of these measurements for model validation and process improvement.

Variable-metric diffraction crystals for x-ray optics

International Nuclear Information System (INIS)

Smither, R.K.; Fernandez, P.B.

1992-01-01

A variable-metric (VM) crystal is one in which the spacing between the crystalline planes changes with position in the crystal. This variation can be either parallel to the crystalline planes or perpendicular to the crystalline planes of interest and can be produced by either introducing a thermal gradient in the crystal or by growing a crystal made of two or more elements and changing the relative percentages of the two elements as the crystal is grown. A series of experiments were performed in the laboratory to demonstrate the principle of the variable-metric crystal and its potential use in synchrotron beam lines. One of the most useful applications of the VM crystal is to increase the number of photons per unit bandwidth in a diffracted beam without losing any of the overall intensity. In a normal synchrotron beam line that uses a two-crystal monochromator, the bandwidth of the diffracted photon beam is determined by the vertical opening angle of the beam which is typically 0.10--0.30 mrad or 20--60 arcsec. When the VM crystal approach is applied, the bandwidth of the beam can be made as narrow as the rocking curve of the diffracting crystal, which is typically 0.005--0.050 mrad or 1--10 arcsec. Thus a very large increase of photons per unit bandwidth (or per unit energy) can be achieved through the use of VM crystals. When the VM principle is used with bent crystals, new kinds of x-ray optical elements can be generated that can focus and defocus x-ray beams much like simple lenses where the focal length of the lens can be changed to match its application. Thus both large magnifications and large demagnifications can be achieved as well as parallel beams with narrow bandwidths

Advanced Nanoscale Characterization of Cement Based Materials Using X-Ray Synchrotron Radiation: A Review

KAUST Repository

Chae, Sejung R.

2013-05-22

We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed-a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction. © 2013 The Author(s).

X-Ray Scattering Applications Using Pulsed X-Ray Sources

Energy Technology Data Exchange (ETDEWEB)

Larson, B.C.

1999-05-23

Pulsed x-ray sources have been used in transient structural phenomena investigations for over fifty years; however, until the advent of synchrotrons sources and the development of table-top picosecond lasers, general access to ligh temporal resolution x-ray diffraction was relatively limited. Advances in diffraction techniques, sample excitation schemes, and detector systems, in addition to IncEased access to pulsed sources, have ld tO what is now a diverse and growing array of pulsed-source measurement applications. A survey of time-resolved investigations using pulsed x-ray sources is presented and research opportunities using both present and planned pulsed x-ray sources are discussed.

Evaluating scintillator performance in time-resolved hard X-ray studies at synchrotron light sources.

Science.gov (United States)

Rutherford, Michael E; Chapman, David J; White, Thomas G; Drakopoulos, Michael; Rack, Alexander; Eakins, Daniel E

2016-05-01

The short pulse duration, small effective source size and high flux of synchrotron radiation is ideally suited for probing a wide range of transient deformation processes in materials under extreme conditions. In this paper, the challenges of high-resolution time-resolved indirect X-ray detection are reviewed in the context of dynamic synchrotron experiments. In particular, the discussion is targeted at two-dimensional integrating detector methods, such as those focused on dynamic radiography and diffraction experiments. The response of a scintillator to periodic synchrotron X-ray excitation is modelled and validated against experimental data collected at the Diamond Light Source (DLS) and European Synchrotron Radiation Facility (ESRF). An upper bound on the dynamic range accessible in a time-resolved experiment for a given bunch separation is calculated for a range of scintillators. New bunch structures are suggested for DLS and ESRF using the highest-performing commercially available crystal LYSO:Ce, allowing time-resolved experiments with an interframe time of 189 ns and a maximum dynamic range of 98 (6.6 bits).

X-ray topography and multiple diffraction

International Nuclear Information System (INIS)

Chang, S.-L.

1983-01-01

A short summary on X-ray topography, which is based on the dynamical theory of X-ray diffraction, is made. The applications and properties related to the use of the multiple diffraction technique are analized and discussed. (L.C.) [pt

A preliminary study of synchrotron light sources for x-ray lithography

International Nuclear Information System (INIS)

Hoffmann, C.R.; Bigham, C.B.; Ebrahim, N.A.; Sawicki, J.A.; Taylor, T.

1989-02-01

A preliminary study of synchrotron light sources has been made, primarily oriented toward x-ray lithography. X-ray lithography is being pursued vigorously in several countries, with a goal of manufacturing high-density computer chips (0.25 μm feature sizes), and may attain commercial success in the next decade. Many other applications of soft x-rays appear worthy of investigation as well. The study group visited synchrotron radiation facilities and had discussions with members of the synchrotron radiation community, particularly Canadians. It concluded that accelerator technology for a conventional synchrotron light source appropriate for x-ray lithography is well established and is consistent with skills and experience at Chalk River Nuclear Laboratories. Compact superconducting systems are being developed also. Their technical requirements overlap with capabilities at Chalk River. (32 refs)

Crystallization and preliminary X-ray diffraction analysis of maize aldose reductase

Energy Technology Data Exchange (ETDEWEB)

Kiyota, Eduardo [Laboratório de Biologia Estrutural, Instituto de Química, Universidade Estadual de Campinas, CP 6154, 13083-970 Campinas-SP (Brazil); Centro de Biologia Molecular e Engenharia Genética, Universidade Estadual de Campinas, Campinas-SP (Brazil); Sousa, Sylvia Morais de [Centro de Biologia Molecular e Engenharia Genética, Universidade Estadual de Campinas, Campinas-SP (Brazil); Santos, Marcelo Leite dos; Costa Lima, Aline da [Laboratório de Biologia Estrutural, Instituto de Química, Universidade Estadual de Campinas, CP 6154, 13083-970 Campinas-SP (Brazil); Menossi, Marcelo [Departamento de Genética e Evolução, Instituto de Biologia, Universidade Estadual de Campinas, Campinas-SP (Brazil); Yunes, José Andrés [Laboratório de Biologia Molecular, Centro Infantil Boldrini, Campinas-SP (Brazil); Aparicio, Ricardo, E-mail: aparicio@iqm.unicamp.br [Laboratório de Biologia Estrutural, Instituto de Química, Universidade Estadual de Campinas, CP 6154, 13083-970 Campinas-SP (Brazil)

2007-11-01

Preliminary X-ray diffraction studies of apo maize aldose reductase at 2.0 Å resolution are reported. Maize aldose reductase (AR) is a member of the aldo-keto reductase superfamily. In contrast to human AR, maize AR seems to prefer the conversion of sorbitol into glucose. The apoenzyme was crystallized in space group P2{sub 1}2{sub 1}2{sub 1}, with unit-cell parameters a = 47.2, b = 54.5, c = 100.6 Å and one molecule in the asymmetric unit. Synchrotron X-ray diffraction data were collected and a final resolution limit of 2.0 Å was obtained after data reduction. Phasing was carried out by an automated molecular-replacement procedure and structural refinement is currently in progress. The refined structure is expected to shed light on the functional/enzymatic mechanism and the unusual activities of maize AR.

Crystallization and preliminary X-ray diffraction analysis of maize aldose reductase

International Nuclear Information System (INIS)

Kiyota, Eduardo; Sousa, Sylvia Morais de; Santos, Marcelo Leite dos; Costa Lima, Aline da; Menossi, Marcelo; Yunes, José Andrés; Aparicio, Ricardo

2007-01-01

Preliminary X-ray diffraction studies of apo maize aldose reductase at 2.0 Å resolution are reported. Maize aldose reductase (AR) is a member of the aldo-keto reductase superfamily. In contrast to human AR, maize AR seems to prefer the conversion of sorbitol into glucose. The apoenzyme was crystallized in space group P2 1 2 1 2 1 , with unit-cell parameters a = 47.2, b = 54.5, c = 100.6 Å and one molecule in the asymmetric unit. Synchrotron X-ray diffraction data were collected and a final resolution limit of 2.0 Å was obtained after data reduction. Phasing was carried out by an automated molecular-replacement procedure and structural refinement is currently in progress. The refined structure is expected to shed light on the functional/enzymatic mechanism and the unusual activities of maize AR

Elasticity of Tantalum to 105 Gpa using a stress and angle-resolved x-ray diffraction

International Nuclear Information System (INIS)

Cynn, H; Yoo, C S

1999-01-01

Determining the mechanical properties such as elastic constants of metals at Mbar pressures has been a difficult task in experiment. Following the development of anisotropic elastic theory by Singh et al.[l], Mao et a1.[2] have recently developed a novel experimental technique to determine the elastic constants of Fe by using the stress and energy-dispersive x-ray diffraction (SEX). In this paper, we present an improved complementary technique, stress and angle-resolved x-ray diffraction (SAX), which we have applied to determine the elastic constants of tantalum to 105 GPa. The extrapolation of the tantalum elastic data shows an excellent agreement with the low-pressure ultrasonic data[3]. We also discuss the improvement of this SAX method over the previous SEX.[elastic constant, anisotropic elastic theory, angle-dispersive synchrotron x-ray diffraction, mechanical properties

Setup for in situ X-ray diffraction studies of thin film growth by magnetron sputtering

CERN Document Server

Ellmer, K; Weiss, V; Rossner, H

2001-01-01

A novel method is described for the in situ-investigation of nucleation and growth of thin films during magnetron sputtering. Energy dispersive X-ray diffraction with synchrotron light is used for the structural analysis during film growth. An in situ-magnetron sputtering chamber was constructed and installed at a synchrotron radiation beam line with a bending magnet. The white synchrotron light (1-70 keV) passes the sputtering chamber through Kapton windows and hits one of the substrates on a four-fold sample holder. The diffracted beam, observed under a fixed diffraction angle between 3 deg. and 10 deg., is energy analyzed by a high purity Ge-detector. The in situ-EDXRD setup is demonstrated for the growth of tin-doped indium oxide (ITO) films prepared by reactive magnetron sputtering from a metallic target.

X-ray diffraction studies of silicon implanted with high energy ions

Energy Technology Data Exchange (ETDEWEB)

Wieteska, K [Institute of Atomic Energy, Otwock-Swierk, (Poland); Wierzchowski, W [Institute of Electronic Materials Technology, Warsaw, (Poland); Graeff, W [Hasylab at Desy, Hamburg, (Germany)

1997-12-31

The character of lattice deformation in silicon in implanted with high energy {alpha} particles and protons was studied with a number of X-ray methods. The experiments included double crystal spectrometer method as well as single crystal section and projection topography realised both with conventional and synchrotron X-ray sources. All observed diffraction patterns were reasonably explainable assuming the lattice parameter depth distribution proportional to the vacancy-interstitial distribution coming from the Biersack-Ziegler theory. The theoretical rocking curves and density distribution in back-reflection double-crystal and section topography well corresponding to experimental results were calculated using numerical integration of the Takagi-Taupin equations. 9 figs.

Optics for protein microcrystallography using synchrotron and laboratory X-ray sources

International Nuclear Information System (INIS)

Varghese, J.N.; Van Donkelaar, A.; Balaic, D.X.; Barnea, Z.

2000-01-01

Full text: For protein crystallography, a highly-intense focused beam overcomes a serious constraint in current biological research: the inability of many protein molecules to form crystals larger than a few tens of microns in size. High structure-resolution X-ray diffraction analysis of microcrystals is currently only being studied at synchrotron X-ray sources. We shall examine how this is being carried out, and also report the development of a novel tapered glass monocapillary toroidal-mirror optic, which achieves a high-intensity, low-divergence focused beam from a rotating-anode Xray generator. We have used this optic, which demonstrates an ∼28x intensity gain at the beam focus to solve the structure of a plant exoglucanse/inhibtor complex microcrystal to 2.8 Angstroms, with volume equivalent to a 30-micron-edge cube

Electrochemical cell for in situ x-ray diffraction under ultrapure conditions

DEFF Research Database (Denmark)

Koop, T.; Schindler, W.; Kazimirov, A.

1998-01-01

within a few seconds. The oxygen level in the electrolyte is reduced by continuous N(2) flow to less than 0.2% compared to that of a fresh electrolyte. This can be done while rotating the cell by 360 degrees about the surface normal. The electrode potential is accurately measured at the position......An electrochemical cell has been developed for in situ x-ray diffraction from a working electrode under clean conditions equivalent to ultrahigh vacuum conditions of 5 x 10(-10) mbar. The substrate crystals can be prepared ex situ and transferred into the cell under protection of ultrapure water...... of the crystal using a Luggin capillary and a standard reference electrode. We demonstrate the performance of our cell by in situ synchrotron x-ray diffraction measurements on ultrathin Co layers electrodeposited on Cu(001) in an aqueous H(2)SO(4)/CoSO(4) solution. (C) 1998 American Institute of Physics....

Status of the Nanoscopium Scanning Hard X-ray Nanoprobe Beamline of Synchrotron Soleil

Science.gov (United States)

Somogyi, A.; Kewish, C. M.; Ribbens, M.; Moreno, T.; Polack, F.; Baranton, G.; Desjardins, K.; Samama, J. P.

2013-10-01

The Nanoscopium 155 m-long scanning hard X-ray nanoprobe beamline of Synchrotron Soleil (St Aubin, France) is dedicated to quantitative multi-modal 2D/3D imaging. The beamline aims to reach down to 30 nm spatial resolution in the 5-20 keV energy range. Two experimental stations working in consecutive operation mode will be dedicated to coherent diffractive imaging and scanning X-ray nanoprobe techniques. The beamline is in the construction phase, the first user experiments are expected in 2014. The main characteristics of the beamline and an overview of its status are given in this paper.

Status of the Nanoscopium Scanning Hard X-ray Nanoprobe Beamline of Synchrotron Soleil

International Nuclear Information System (INIS)

Somogyi, A; Kewish, C M; Ribbens, M; Moreno, T; Polack, F; Baranton, G; Desjardins, K; Samama, J P

2013-01-01

The Nanoscopium 155 m-long scanning hard X-ray nanoprobe beamline of Synchrotron Soleil (St Aubin, France) is dedicated to quantitative multi-modal 2D/3D imaging. The beamline aims to reach down to 30 nm spatial resolution in the 5–20 keV energy range. Two experimental stations working in consecutive operation mode will be dedicated to coherent diffractive imaging and scanning X-ray nanoprobe techniques. The beamline is in the construction phase, the first user experiments are expected in 2014. The main characteristics of the beamline and an overview of its status are given in this paper

Kinetics of the main phase transition of hydrated lecithin monitored by real-time x-ray diffraction

International Nuclear Information System (INIS)

Caffrey, M.; Bilderback, D.H.

1984-01-01

A method is described for observing and recording in real-time x-ray diffraction from an unoriented hydrated membrane lipid, dipalmitoylphosphatidylcholine (DPPC), through its thermotropic gel/liquid crystal phase transition. Synchrotron radiation from the Cornell High Energy Synchrotron Source (Ithaca, New York) was used as an x-ray source of extremely high brilliance and the dynamic display of the diffraction image was effected using a three-stage image intensifier tube coupled to an external fluorescent screen. The image on the output phosphor was sufficiently intense to be recorded cinematographically and to be displayed on a television monitor using a vidicon camera at 30 frames x s -1 . These measurements set an upper limit of 2 s on the DPPC gel → liquid crystal phase transition and indicate that the transition is a two-state process. The real-time method couples the power of x-ray diffraction as a structural probe with the ability to follow kinetics of structural changes. The method does not require an exogenous probe, is relatively nonperturbing, and can be used with membranes in a variety of physical states and with unstable samples. The method has the additional advantage over its static measurement counterpart in that it is more likely to detect transiently stable intermediates if present

Identification of copper-based green pigments in Jaume Huguet's Gothic altarpieces by Fourier transform infrared microspectroscopy and synchrotron radiation X-ray diffraction.

Science.gov (United States)

Salvadó, N; Pradell, T; Pantos, E; Papiz, M Z; Molera, J; Seco, M; Vendrell-Saz, M

2002-07-01

The scientific investigation of ancient paintings gives a unique insight into ancient painting techniques and their evolution through time and geographic location. This study deals with the identification of the green pigments used by one of the most important Catalan masters in Gothic times, Jaume Huguet. Other pigments and materials have also been characterized by means of conventional techniques such as optical microscopy, scanning electron microscopy and Fourier transform infrared spectroscopy. Synchrotron radiation X-ray diffraction has been used to produce maps of phases at a spatial resolution of 100 microm across chromatic layers.

Application of synchrotron radiation to x-ray fluorescence analysis of trace elements

International Nuclear Information System (INIS)

Gordon, B.M.; Jones, K.W.; Hanson, A.L.

1986-08-01

The development of synchrotron radiation x-ray sources has provided the means to greatly extend the capabilities of x-ray fluorescence analysis for determinations of trace element concentrations. A brief description of synchrotron radiation properties provides a background for a discussion of the improved detection limits compared to existing x-ray fluorescence techniques. Calculated detection limits for x-ray microprobes with micrometer spatial resolutions are described and compared with experimental results beginning to appear from a number of laboratories. The current activities and future plans for a dedicated x-ray microprobe beam line at the National Synchrotron Light Source (NSLS) of Brookhaven National Laboratory are presented

Synchrotron radiation calibration for soft X-ray detector

International Nuclear Information System (INIS)

Ning, Jiamin; Guo, Cun; Xu, Rongkun; Jiang, Shilun; Xu, Zeping; Chen, Jinchuan; Xia, Guangxin; Xue, Feibiao; Qin, Yi

2009-04-01

The calibration experiments were carried out to X-ray film, scintillator and transmission grating by employing the soft X-ray station at 3W1B beam-line in Beijing synchrotron Radiation Facility. The experiments presented the black intensity curve and energy response curve of soft X-ray film. And the experimental results can be used in diagnosis of X-ray radiation characterization of Z-pinch, such as in the measurement of soft X-ray Power Meter, grating spectrometer, pinhole camera and one-dimension imaging system which can ensure precision of Z-pinch results. (authors)

Hard X-ray Sources for the Mexican Synchrotron Project

International Nuclear Information System (INIS)

Reyes-Herrera, Juan

2016-01-01

One of the principal tasks for the design of the Mexican synchrotron was to define the storage ring energy. The main criteria for choosing the energy come from studying the electromagnetic spectrum that can be obtained from the synchrotron, because the energy range of the spectrum that can be obtained will determine the applications available to the users of the future light source. Since there is a public demand of hard X-rays for the experiments in the synchrotron community users from Mexico, in this work we studied the emission spectra from some hard X-ray sources which could be the best options for the parameters of the present Mexican synchrotron design. The calculations of the flux and the brightness for one Bending Magnet and four Insertion Devices are presented; specifically, for a Superconducting Bending Magnet (SBM), a Superconducting Wiggler (SCW), an In Vacuum Short Period Undulator (IV-SPU), a Superconducting Undulator (SCU) and for a Cryogenic Permanent Magnet Undulator (CPMU). Two commonly available synchrotron radiation programs were used for the computation (XOP and SRW). From the results, it can be concluded that the particle beam energy from the current design is enough to have one or more sources of hard X-rays. Furthermore, a wide range of hard X-ray region can be covered by the analyzed sources, and the choice of each type should be based on the specific characteristics of the X-ray beam to perform the experiments at the involved beamline. This work was done within the project Fomix Conacyt-Morelos ”Plan Estrategico para la construccion y operación de un Sincrotron en Morelos” (224392). (paper)

Hard X-ray Sources for the Mexican Synchrotron Project

Science.gov (United States)

Reyes-Herrera, Juan

2016-10-01

One of the principal tasks for the design of the Mexican synchrotron was to define the storage ring energy. The main criteria for choosing the energy come from studying the electromagnetic spectrum that can be obtained from the synchrotron, because the energy range of the spectrum that can be obtained will determine the applications available to the users of the future light source. Since there is a public demand of hard X-rays for the experiments in the synchrotron community users from Mexico, in this work we studied the emission spectra from some hard X-ray sources which could be the best options for the parameters of the present Mexican synchrotron design. The calculations of the flux and the brightness for one Bending Magnet and four Insertion Devices are presented; specifically, for a Superconducting Bending Magnet (SBM), a Superconducting Wiggler (SCW), an In Vacuum Short Period Undulator (IV-SPU), a Superconducting Undulator (SCU) and for a Cryogenic Permanent Magnet Undulator (CPMU). Two commonly available synchrotron radiation programs were used for the computation (XOP and SRW). From the results, it can be concluded that the particle beam energy from the current design is enough to have one or more sources of hard X-rays. Furthermore, a wide range of hard X-ray region can be covered by the analyzed sources, and the choice of each type should be based on the specific characteristics of the X-ray beam to perform the experiments at the involved beamline. This work was done within the project Fomix Conacyt-Morelos ”Plan Estrategico para la construccion y operación de un Sincrotron en Morelos” (224392).

An in situ synchrotron X-ray diffraction study of precipitation kinetics in a severely deformed Cu–Ni–Si alloy

Energy Technology Data Exchange (ETDEWEB)

Azzeddine, H.; Mehdi, B. [Faculty of Physics, USTHB, BP 32 El-Alia, Dar El Beida, Algiers (Algeria); Hennet, L. [Conditions Extrêmes et Matériaux: Haute Température et Irradiation, CNRS-CEMHTI, 1D Ave de la Recherche Scientifique, 45071 Orléans Cedex 2 (France); Thiaudière, D. [Synchrotron SOLEIL, L' Orme des Merisiers, Saint-Aubin, 91192 Gif-sur-Yvette Cedex (France); Alili, B. [Faculty of Physics, USTHB, BP 32 El-Alia, Dar El Beida, Algiers (Algeria); Kawasaki, M., E-mail: megumi@hanyang.ac.kr [Division of Materials Science and Engineering, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul 133-791 (Korea, Republic of); Departments of Aerospace and Mechanical Engineering and Materials Science, University of Southern California, Los Angeles, CA 90089-1453 (United States); Bradai, D. [Faculty of Physics, USTHB, BP 32 El-Alia, Dar El Beida, Algiers (Algeria); Langdon, T.G. [Departments of Aerospace and Mechanical Engineering and Materials Science, University of Southern California, Los Angeles, CA 90089-1453 (United States); Materials Research Group, Faculty of Engineering and the Environment, University of Southampton, Southampton SO17 1BJ (United Kingdom)

2014-03-01

In situ synchrotron X-ray diffraction was used to study the decomposition kinetics of a metastable Cu–2.5Ni–0.6Si (wt%) alloy after severe plastic deformation by equal-channel angular pressing (ECAP) and high-pressure torsion (HPT). The measurements were performed at room temperature and also at high temperatures of 723, 823 and 973 K in order to determine the ageing effect after processing. Two forms of precipitates, namely δ-Ni{sub 2}Si and γ-Ni{sub 5}Si{sub 2}, were identified and the sequence of their appearance was well established for ECAP processing and ageing. There was no detection of either a modulated structure resulting from spinodal decomposition or an ordered structure nucleated from the modulated structure. An X-ray hybrid pixel array detector (XPAD-S140 detector) permitted the detection of the nucleation stages of the δ-Ni{sub 2}Si phase that began soon after 24 s of ageing at 723 K. There was also no trace of any amorphization of the matrix phase.

Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with focused ion beam patterning for d{sub o} evaluation

Energy Technology Data Exchange (ETDEWEB)

Baimpas, Nikolaos, E-mail: nikolaos.baimpas@eng.ox.ac.uk [University of Oxford, Dept. of Engineering Science (United Kingdom); Le Bourhis, Eric [University of Poitiers, Institut P' , Laboratoire de Physique des Matériaux, Poitiers (France); Eve, Sophie [ENSICAEN, CRISMAT, Caen (France); Thiaudière, Dominique [Synchrotron SOLEIL, L' Orme des Merisiers Saint-Aubin, Paris (France); Hardie, Christopher [University of Oxford, Materials Department (United Kingdom); Korsunsky, Alexander M. [University of Oxford, Dept. of Engineering Science (United Kingdom)

2013-12-31

Nanocrystalline metallic coatings of sub-micron thickness are widely used in modern microelectronic applications. In X-ray diffraction experiments to determine both the residual and applied stresses in nanocrystalline coatings, one difficult challenge that comes up invariably is the determination of the strain-free lattice spacing d{sub o}. The present study addresses this challenge by using the focused ion beam (FIB) to generate a built-in strain-free reference by patterning (milling) a 50 × 50 μm{sup 2} region of the coating to produce an array of small stress-relieved “islands” ∼ 0.8 × 0.8 μm{sup 2} each. Transmission X-ray diffraction setup was used for data collection at DIFFABS beamline (Synchrotron SOLEIL, France). A 150 nm-thick multi-layered W–Cu nano-composite thin film on polyimide (Kapton®) substrate was studied. The samples were loaded incrementally using a compact uniaxial loading device, and micro-beam diffraction data were collected on and away from the reference array. It was shown experimentally that the “island” array remained approximately strain free throughout the experiment, providing an on-board d{sub o} lattice spacing reference. The changing lattice spacing d in the coating was also monitored away from the array, to deduce the elastic strain evolution during deformation. The results and their implications are presented and discussed. - Highlights: • In situ deformation study of laminate polycrystalline W–Cu thin films • Focused ion beam (FIB) patterning of an array of “islands” on thin films surface • X-ray diffraction on island-patterned region • Constant strain on “islands” independently of the deformation of the substrate.

Static tensile deformation behavior of a lean duplex stainless steel studied by in situ neutron diffraction and synchrotron radiation white x-rays

International Nuclear Information System (INIS)

Tsuchida, Noriyuki; Kawahata, Taiji; Ishimaru, Eiichiro; Takahashi, Akihiko; Suzuki, Hiroshi; Shobu, Takahisa

2013-01-01

To investigate the tensile deformation behavior of a lean duplex stainless steel (S32101) from the viewpoints of plastic deformability among phases or grains, we performed static tensile tests, in situ neutron diffraction, and white x-ray diffraction experiments at room temperature. In the static tensile tests, the S32101 steel displayed a larger uniform elongation and a better tensile strength-uniform elongation balance than a commercial SUS329J4L duplex stainless steel. A larger uniform elongation of S32101 is associated with the macroscopic work hardening behavior that a work hardening rate higher than the flow stress can maintain up until high true strains. From the experimental results of synchrotron radiation white x-ray diffraction experiments, the hard phase of S32101 was changed from the ferrite (α) phase to austenite (γ) one during tensile deformation. This led to a larger stress partitioning between the phases at the latter stage of deformation. From the experimental results of in situ neutron diffraction, it was found that the stress partitioning of the γ phase in the S32101 was the largest among the present results. Therefore, the larger work hardening rate of S32101 can be explained by the large stress partitioning of the γ phase, that between γ and α phases and γ volume fraction. (author)

Synchrotron diffraction characterization of nanostructured KY{sub 3}F{sub 10}:Tb

Energy Technology Data Exchange (ETDEWEB)

Ichikawa, Rodrigo U.; Teixeira, Maria I.; Ranieri, Izilda M.; Martinez, Luis G., E-mail: ichikawa@usp.br, E-mail: miteixeira@ipen.br, E-mail: iranieri@ipen.br, E-mail: lgallego@ipen.br [Instituto de Pesquisas Energeticas e Nucleares (IPEN/CNEN-SP), Sao Paulo, SP (Brazil); Linhares, Horacio M.S.M.D., E-mail: horacio_marconi@yahoo.com.br [Universidade Federal Fluminense (INFES/UFF), Santo Antonio de Padua, RJ (Brazil); Turrillas, Xavier, E-mail: turrillas@gmail.com [Institut de Ciència de Materials de Barcelona (ICMAB/CSIC), Dept. of Crystallography, Bellaterra (Spain)

2015-07-01

Nanostructured rare-earth fluorides materials are being intensively studied recently due to their potential applications in high-dose dosimetry. Particularly, nanostructured Tb-doped KY{sub 3}F{sub 10} has shown satisfactory results to be used in this area. In the present work, the structure and microstructure of KY{sub 3}F{sub 10}:Tb was investigated by means of X-ray synchrotron diffraction. One of the samples was analyzed as synthesized and another after a heat treatment. Rietveld refinement of synchrotron diffraction data was applied to obtain cell parameters, atomic positions and atomic displacement factors and the results were compared to values found in literature. X-ray line profile analysis methods were applied to determine mean crystallite sizes and their distribution. (author)

Time-resolved diffraction studies of muscle using synchrotron radiation

International Nuclear Information System (INIS)

Harford, Jeffrey; Squire, John

1997-01-01

Muscle contraction is one of those biological phenomena that we can all appreciate in our everyday lives. Sometimes it is when we are resting quietly and are aware of our heartbeat. At other times it may be when we are exerting ourselves and become short of breath, or when we exercise for a long period and our muscles start to ache. The way in which muscles produce force has exercised the minds of philosophers and scientists at least since the days of Erasistratus in the third century BC. Nowadays, of course, we know a very great deal about muscle structure, physiology and biochemistry, but we still do not know exactly what the molecular process is that produces movement. An ideal way of probing this process would be to be able to obtain signals from the relevant molecules as they actually go through their normal force-generating routine in an active muscle. The spatial dimensions involved are in the region of 1-50 nm, thus precluding the use of light microscopy, and the time regime is microseconds to milliseconds. Techniques with the appropriate spatial resolution might be electron microscopy and x-ray diffraction, but electron microscopy cannot yet be carried out on living tissue. X-ray diffraction methods can clearly have the right sort of spatial resolution, but what about recording diffraction patterns in the very short times involved (say 1 ms)? It is here that the high flux from synchrotron storage rings comes into its own. Using synchrotron radiation from, say, the SRS at the CCLRC Daresbury Laboratory it is possible to record x-ray diffraction patterns from living muscles in the millisecond time regime and to follow how these diffraction patterns change as the muscles go through typical contraction cycles. Unfortunately, x-ray diffraction is not a direct imaging method; the observed distribution of diffracted intensity needs to be interpreted in some way to give useful information on the spatial relationships of the force-generating molecules. This review

Synchrotron X-ray diffraction studies of phase transitions in physisorbed monolayers of rare gases on graphite

International Nuclear Information System (INIS)

Bohr, J.

1984-01-01

This study is an investigation of phase transition in monoatomic layers adsorbed on graphite. Such effects can be considered physical realizations of two-dimensional systems. The experimental technique used is synchrotron X-ray diffraction. Systems which have been investigated include the commensurate-incommensurate phase transition in krypton monolayer. By adjusting the spreading pressure in the krypton layer by means of a coadsorbent deuterium gas it has been unambiguously demonstrated that at low temperatures the phase transition is of first order. A melting study of incommensurate argon monolayers demonstrates an experimental verification of the possibility for having a continuous melting transition in two-dimensions. Mixtures of two-components have been investigated for their phases. No (chemical) order-disorder transition is seen. A discussion is given on this lack of a chemical order. This lack is utilized to study the commensurate-incommensurate phase transition driven by average particle size. Finally, a special low-temperature phase is identified in a xenon monlayer which is diluted with freon. (Auth.)

Crystal structure and charge density analysis of Li2NH by synchrotron X-ray diffraction

International Nuclear Information System (INIS)

Noritake, T.; Nozaki, H.; Aoki, M.; Towata, S.; Kitahara, G.; Nakamori, Y.; Orimo, S.

2005-01-01

Complex hydrides, such as lithium amide (LiNH 2 ) and lithium imide (Li 2 NH), have recently been noticed as one of the most promising materials for reversible hydrogen storage. In this paper, we reveal the bonding nature of hydrogen in Li 2 NH crystal by synchrotron powder X-ray diffraction measurement at room temperature. The crystal structure was refined by Rietveld method and the charge density distribution was analyzed by maximum entropy method (MEM). The Li 2 NH crystal is anti-fluorite type structure (space group Fm3-bar m) consisting of Li and NH. Hydrogen atom occupies randomly the 48h (Wyckoff notation) sites around N atom. The refined lattice constant is a=5.0742(2)A. The charge density distribution around NH anion in Li 2 NH is almost spherical. The number of electrons within the sphere around the Li and NH is estimated from the obtained charge density distribution. As the result, the ionic charge is expressed as [Li 0.99+ ] 2 [NH] 1.21- . Therefore, it is confirmed experimentally that Li 2 NH is ionically bonded

New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging

Energy Technology Data Exchange (ETDEWEB)

Ludwig, W., E-mail: ludwig@esrf.fr [Universite de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne (France); European Synchrotron Radiation Facility, BP220, 38043 Grenoble (France); King, A. [European Synchrotron Radiation Facility, BP220, 38043 Grenoble (France); School of Materials, University of Manchester, Manchester, M13 9PL (United Kingdom); Reischig, P. [European Synchrotron Radiation Facility, BP220, 38043 Grenoble (France); Herbig, M. [Universite de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne (France); Lauridsen, E.M.; Schmidt, S. [Riso National Laboratory for Sustainable Energy, Technical University of Denmark, P.O. Box 49, DK-4000 Roskilde (Denmark); Proudhon, H.; Forest, S. [MINES ParisTech, Centre des materiaux, CNRS UMR 7633, BP 87, 91003 Evry Cedex (France); Cloetens, P.; Roscoat, S. Rolland du [European Synchrotron Radiation Facility, BP220, 38043 Grenoble (France); Buffiere, J.Y. [Universite de Lyon, INSA-Lyon, MATEIS CNRS UMR 5510, 69621Villeurbanne (France); Marrow, T.J. [School of Materials, University of Manchester, Manchester, M13 9PL (United Kingdom); Poulsen, H.F. [Riso National Laboratory for Sustainable Energy, Technical University of Denmark, P.O. Box 49, DK-4000 Roskilde (Denmark)

2009-10-25

Non-destructive, three-dimensional (3D) characterization of the grain structure in mono-phase polycrystalline materials is an open challenge in material science. Recent advances in synchrotron based X-ray imaging and diffraction techniques offer interesting possibilities for mapping 3D grain shapes and crystallographic orientations for certain categories of polycrystalline materials. Direct visualisation of the three-dimensional grain boundary network or of two-phase (duplex) grain structures by means of absorption and/or phase contrast techniques may be possible, but is restricted to specific material systems. A recent extension of this methodology, termed X-ray diffraction contrast tomography (DCT), combines the principles of X-ray diffraction imaging, three-dimensional X-ray diffraction microscopy (3DXRD) and image reconstruction from projections. DCT provides simultaneous access to 3D grain shape, crystallographic orientation and local attenuation coefficient distribution. The technique applies to the larger range of plastically undeformed, polycrystalline mono-phase materials, provided some conditions on grain size and texture are fulfilled. The straightforward combination with high-resolution microtomography opens interesting new possibilities for the observation of microstructure related damage and deformation mechanisms in these materials.

New opportunities for 3D materials science of polycrystalline materials at the micrometre lengthscale by combined use of X-ray diffraction and X-ray imaging

International Nuclear Information System (INIS)

Ludwig, W.; King, A.; Reischig, P.; Herbig, M.; Lauridsen, E.M.; Schmidt, S.; Proudhon, H.; Forest, S.; Cloetens, P.; Roscoat, S. Rolland du; Buffiere, J.Y.; Marrow, T.J.; Poulsen, H.F.

2009-01-01

Non-destructive, three-dimensional (3D) characterization of the grain structure in mono-phase polycrystalline materials is an open challenge in material science. Recent advances in synchrotron based X-ray imaging and diffraction techniques offer interesting possibilities for mapping 3D grain shapes and crystallographic orientations for certain categories of polycrystalline materials. Direct visualisation of the three-dimensional grain boundary network or of two-phase (duplex) grain structures by means of absorption and/or phase contrast techniques may be possible, but is restricted to specific material systems. A recent extension of this methodology, termed X-ray diffraction contrast tomography (DCT), combines the principles of X-ray diffraction imaging, three-dimensional X-ray diffraction microscopy (3DXRD) and image reconstruction from projections. DCT provides simultaneous access to 3D grain shape, crystallographic orientation and local attenuation coefficient distribution. The technique applies to the larger range of plastically undeformed, polycrystalline mono-phase materials, provided some conditions on grain size and texture are fulfilled. The straightforward combination with high-resolution microtomography opens interesting new possibilities for the observation of microstructure related damage and deformation mechanisms in these materials.

X-ray and synchrotron studies of porous silicon

Energy Technology Data Exchange (ETDEWEB)

Sivkov, V. N., E-mail: svn@dm.komisc.ru [Russian Academy of Sciences, Komi Scientific Center, Ural Branch (Russian Federation); Lomov, A. A. [Russian Academy of Sciences, Physical-Technological Institute (Russian Federation); Vasil' ev, A. L. [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation); Nekipelov, S. V. [Komi State Pedagogical Institute (Russian Federation); Petrova, O. V. [Russian Academy of Sciences, Komi Scientific Center, Ural Branch (Russian Federation)

2013-08-15

The results of comprehensive studies of layers of porous silicon of different conductivity types, grown by anodizing standard Si(111) substrates in an electrolyte based on fluoric acid and ethanol with the addition of 5% of iodine and kept in air for a long time, are discussed. Measurements are performed by scanning electron microscopy, high-resolution X-ray diffraction, and ultrasoft X-ray spectroscopy using synchrotron radiation. The structural parameters of the layers (thickness, strain, and porosity) and atomic and chemical composition of the porous-silicon surface are determined. It is found that an oxide layer 1.5-2.3-nm thick is formed on the surface of the silicon skeleton. The near-edge fine structure of the Si 2p absorption spectrum of this layer corresponds to the fine structure of the 2p spectrum of well coordinated SiO{sub 2}. In this case, the fine structure in the Si 2p-edge absorption region of the silicon skeleton is identical to that of the 2p absorption spectrum of crystalline silicon.

Magnetic X-Ray Scattering with Synchrotron Radiation

DEFF Research Database (Denmark)

Moncton, D. E.; Gibbs, D.; Bohr, Jakob

1986-01-01

With the availability of high-brilliance synchrotron radiation from multiple wigglers, magnetic X-ray scattering has become a powerful new probe of magnetic structure and phase transitions. Similar to the well-established magnetic neutron scattering technique, magnetic X-ray scattering methods have...... many complementary advantages. A brief review is presented of the history of magnetic X-ray scattering as well as recent results obtained in studies of the rare-earth magnet holmium with emphasis on instrumentational aspects. In particular, the development of a simple polarization analyzer...... to distinguish charge and magnetic scattering is described....

Atomic structure of large angle grain boundaries determined by quantitative X-ray diffraction techniques

International Nuclear Information System (INIS)

Fitzsimmons, M.R.; Sass, S.L.

1988-01-01

Quantitative X-ray diffraction techniques have been used to determine the atomic structure of the Σ = 5 and 13 [001] twist boundaries in Au with a resolution of 0.09 Angstrom or better. The reciprocal lattices of these boundaries were mapped out using synchrotron radiation. The atomic structures were obtained by testing model structures against the intensity observations with a chi square analysis. The boundary structure were modeled using polyhedra, including octahedra, special configurations of tetrahedra and Archimedian anti-prisms, interwoven together by the boundary symmetry. The results of this work point to the possibility of obtaining general rules for grain boundary structure based on X-ray diffraction observations that give the atomic positions with high resolution

Signatures of Synchrotron: Low-cutoff X-ray emission and the hard X-ray spectrum of Cas A

Science.gov (United States)

Stage, Michael D.; Fedor, Emily Elizabeth; Martina-Hood, Hyourin

2018-06-01

In soft X-rays, bright, young Galactic remnants (Cas A, Kepler, Tycho, etc.) present thermal line emission and bremsstrahlung from ejecta, and synchrotron radiation from the shocks. Their hard X-ray spectra tend to be dominated by power-law sources. However, it can be non-trivial to discriminate between contributions from processes such as synchrotron and bremsstrahlung from nonthermally accelerated electrons, even though the energies of the electrons producing this radiation may be very different. Spatially-resolved spectroscopic analysis of 0.5-10 keV observations with, e.g., Chandracan provide leverage in identifying the processes and their locations. Previously, Stage & Allen (2006), Allen & Stage (2007) and Stage & Allen (2011) identified regions characterized by high-cutoff synchrotron radiation. Extrapolating synchrotron model fits to the emission in the Chandra band, they estimated the synchrotron contribution to the hard X-ray spectrum at about one-third the observed flux, fitting the balance with nonthermal bremsstrahlung emission produced by nonthermal electrons in the ejecta. Although it is unlikely this analysis missed regions of the highest-cutoff synchrotron emission, which supplies the bulk of the synchrotron above 15 keV, it may have missed regions of lower-cutoff emission, especially if they are near bright ejecta and the reverse shock. These regions cannot explain the emission at the highest energies (~50 keV), but may make significant contributions to the hard spectrum at lower energies (~10 keV). Using the technique described in Fedor, Martina-Hood & Stage (this meeting), we revisit the analysis to include regions that may be dominated by low-cutoff synchrotron, located in the interior of the remnant, and/or correlated with the reverse shock. Identifying X-ray emission from accelerated electrons associated with the reverse-shock would have important implications for synchrotron and non-thermal bremsstrahlung radiation above the 10 keV.

Crystallization and preliminary X-ray diffraction studies of ferredoxin reductase from Leptospira interrogans

International Nuclear Information System (INIS)

Nascimento, Alessandro S.; Ferrarezi, Thiago; Catalano-Dupuy, Daniela L.; Ceccarelli, Eduardo A.; Polikarpov, Igor

2006-01-01

Crystals adequate for X-ray diffraction analysis have been prepared from L. interrogans ferredoxin-NADP + reductase. Ferredoxin-NADP + reductase (FNR) is an FAD-containing enzyme that catalyzes electron transfer between NADP(H) and ferredoxin. Here, results are reported of the recombinant expression, purification and crystallization of FNR from Leptospira interrogans, a parasitic bacterium of animals and humans. The L. interrogans FNR crystals belong to a primitive monoclinic space group and diffract to 2.4 Å resolution at a synchrotron source

Crystallization and preliminary X-ray diffraction studies of ferredoxin reductase from Leptospira interrogans

Energy Technology Data Exchange (ETDEWEB)

Nascimento, Alessandro S.; Ferrarezi, Thiago [Instituto de Física de São Carlos, Universidade de São Paulo, Av. Trabalhador Saocarlense 400, São Carlos, SP, 13560-970 (Brazil); Catalano-Dupuy, Daniela L.; Ceccarelli, Eduardo A. [Facultad de Ciencias Bioquímicas y Farmacéuticas, Molecular Biology Division, Instituto de Biología Molecular y Celular de Rosario (IBR), CONICET, Universidad Nacional de Rosario, Suipacha 531, S2002LRK Rosario (Argentina); Polikarpov, Igor, E-mail: ipolikarpov@if.sc.usp.br [Instituto de Física de São Carlos, Universidade de São Paulo, Av. Trabalhador Saocarlense 400, São Carlos, SP, 13560-970 (Brazil)

2006-07-01

Crystals adequate for X-ray diffraction analysis have been prepared from L. interrogans ferredoxin-NADP{sup +} reductase. Ferredoxin-NADP{sup +} reductase (FNR) is an FAD-containing enzyme that catalyzes electron transfer between NADP(H) and ferredoxin. Here, results are reported of the recombinant expression, purification and crystallization of FNR from Leptospira interrogans, a parasitic bacterium of animals and humans. The L. interrogans FNR crystals belong to a primitive monoclinic space group and diffract to 2.4 Å resolution at a synchrotron source.

Diffraction peaks in x-ray spectroscopy: Friend or foe?

International Nuclear Information System (INIS)

Tissot, R.G.; Goehner, R.P.

1992-01-01

Diffraction peaks can occur as unidentifiable peaks in the energy spectrum of an x-ray spectrometric analysis. Recently, there has been increased interest in oriented polycrystalline films and epitaxial films on single crystal substrates for electronic applications. Since these materials diffract x-rays more efficiently than randomly oriented polycrystalline materials, diffraction peaks are being observed more frequently in x-ray fluorescent spectra. In addition, micro x-ray spectrometric analysis utilizes a small, intense, collimated x-ray beam that can yield well defined diffraction peaks. In some cases these diffraction peaks can occur at the same position as elemental peaks. These diffraction peaks, although a possible problem in qualitative and quantitative elemental analysis, can give very useful information about the crystallographic structure and orientation of the material being analyzed. The observed diffraction peaks are dependent on the geometry of the x-ray spectrometer, the degree of collimation and the distribution of wavelengths (energies) originating from the x-ray tube and striking the sample

A spectrometer for X-ray energy-dispersive diffraction using synchrotron radiation

International Nuclear Information System (INIS)

Buras, B.; Gerward, L.; Staun Olsen, J.; Steenstrup, S.

1981-10-01

The paper describes a white-beam X-ray energy dispersive diffractometer using the synchroton radiation from the DORIS ESR. The following features of the instrument are discussed: Horizontal or vertical scattering plane, collimators, sample environment, remote control of gonimeter, data acquisition, energy-sensitive detectors using small-area and large-area detector crystals, modes of operation, powder and single crystal diffraction. An example is given from a high-pressure study of YbH 2 using a diamond anvil cell. (orig./HP)

Computed tomography of x-ray index of refraction using the diffraction enhanced imaging method

International Nuclear Information System (INIS)

Dilmanian, F.A.; Ren, B.; Wu, X.Y.; Orion, I.; Zhong, Z.; Thomlinson, W.C.; Chapman, L.D.

2000-01-01

Diffraction enhanced imaging (DEI) is a new, synchrotron-based, x-ray radiography method that uses monochromatic, fan-shaped beams, with an analyser crystal positioned between the subject and the detector. The analyser allows the detection of only those x-rays transmitted by the subject that fall into the acceptance angle (central part of the rocking curve) of the monochromator/analyser system. As shown by Chapman et al , in addition to the x-ray attenuation, the method provides information on the out-of-plane angular deviation of x-rays. New images result in which the image contrast depends on the x-ray index of refraction and on the yield of small-angle scattering, respectively. We implemented DEI in the tomography mode at the National Synchrotron Light Source using 22 keV x-rays, and imaged a cylindrical acrylic phantom that included oil-filled, slanted channels. The resulting 'refraction CT image' shows the pure image of the out-of-plane gradient of the x-ray index of refraction. No image artefacts were present, indicating that the CT projection data were a consistent set. The 'refraction CT image' signal is linear with the gradient of the refractive index, and its value is equal to that expected. The method, at the energy used or higher, has the potential for use in clinical radiography and in industry. (author)

Synchrotron x-ray reflectivity study of oxidation/passivation of copper and silicon

International Nuclear Information System (INIS)

Chu, Y.; Nagy, Z.; Parkhutik, V.; You, H.

1999-01-01

Synchrotron x-ray-scattering technique studies of copper and silicon electrochemical interfaces are reported. These two examples illustrate the application of synchrotron x-ray techniques for oxidation, passivation, and dissolution of metals and semiconductors

Synchrotron x-ray reflectivity study of oxidation/passivation of copper and silicon.

Energy Technology Data Exchange (ETDEWEB)

Chu, Y.; Nagy, Z.; Parkhutik, V.; You, H.

1999-07-21

Synchrotron x-ray-scattering technique studies of copper and silicon electrochemical interfaces are reported. These two examples illustrate the application of synchrotron x-ray techniques for oxidation, passivation, and dissolution of metals and semiconductors.

The equation of state of PbTiO sub 3 up to 37 GPa: a synchrotron x-ray powder diffraction study

CERN Document Server

Sani, A; Levy, D

2002-01-01

High-pressure synchrotron x-ray powder diffraction patterns were collected using ID09 of ESRF (Grenoble, France) for a powder sample of PbTiO sub 3 , placed in a diamond anvil cell. The patterns were collected at room temperature using nitrogen (up to 37 GPa) and methanol-ethanol solution (up to 7 GPa) as pressure-transmitting media. The bulk moduli were calculated for the first time using the Vinet equation of state and they were compared to those of isostructural compounds. The trend of the spontaneous polarization as a function of pressure confirms that the ferroelectric-paraelectric phase transition at 11.2 GPa possesses a second-order character.

Line x-ray source for diffraction enhanced imaging in clinical and industrial applications

Science.gov (United States)

Wang, Xiaoqin

Mammography is one type of imaging modalities that uses a low-dose x-ray or other radiation sources for examination of breasts. It plays a central role in early detection of breast cancers. The material similarity of tumor-cell and health cell, breast implants surgery and other factors, make the breast cancers hard to visualize and detect. Diffraction enhanced imaging (DEI), first proposed and investigated by D. Chapman is a new x-ray radiographic imaging modality using monochromatic x-rays from a synchrotron source, which produced images of thick absorbing objects that are almost completely free of scatter. It shows dramatically improved contrast over standard imaging when applied to the same phantom. The contrast is based not only on attenuation but also on the refraction and diffraction properties of the sample. This imaging method may improve image quality of mammography, other medical applications, industrial radiography for non-destructive testing and x-ray computed tomography. However, the size, and cost, of a synchrotron source limits the application of the new modality to be applicable at clinical levels. This research investigates the feasibility of a designed line x-ray source to produce intensity compatible to synchrotron sources. It is composed of a 2-cm in length tungsten filament, installed on a carbon steel filament cup (backing plate), as the cathode and a stationary oxygen-free copper anode with molybdenum coating on the front surface serves as the target. Characteristic properties of the line x-ray source were computationally studied and the prototype was experimentally investigated. SIMIION code was used to computationally study the electron trajectories emanating from the filament towards the molybdenum target. A Faraday cup on the prototype device, proof-of-principle, was used to measure the distribution of electrons on the target, which compares favorably to computational results. The intensities of characteristic x-ray for molybdenum

Synchrotron X-ray PIV Technique for Measurement of Blood Flow Velocity

International Nuclear Information System (INIS)

Kim, Guk Bae; Lee, Sang Joon; Je, Jung Ho

2007-01-01

Synchrotron X-ray micro-imaging method has been used to observe internal structures of various organisms, industrial devices, and so on. However, it is not suitable to see internal flows inside a structure because tracers typically employed in conventional optical flow visualization methods cannot be detectable with the X-ray micro-imaging method. On the other hand, a PIV (particle image velocimetry) method which has recently been accepted as a reliable quantitative flow visualization technique can extract lots of flow information by applying digital image processing techniques However, it is not applicable to opaque fluids such as blood. In this study, we combined the PIV method and the synchrotron X-ray micro-imaging technique to compose a new X-ray PIV technique. Using the X-ray PIV technique, we investigated the optical characteristics of blood for a coherent synchrotron X-ray beam and quantitatively visualized real blood flows inside an opaque tube without any contrast media. The velocity field information acquired would be helpful for investigating hemorheologic characteristics of the blood flow

A synchrotron radiation facility for x-ray astronomy

DEFF Research Database (Denmark)

Hall, C.J.; Lewis, R.A.; Christensen, Finn Erland

1997-01-01

A proposal for an x-ray optics test facility based at a synchrotron radiation source is presented. The facility would incorporate a clean preparation area, and a large evacuable test area. The advantages of using a synchrotron as the source of the test radiation are discussed. These include the a...

X-ray diffraction and X-ray K absorption near edge studies of copper (II) complexes with amino acids

Science.gov (United States)

Sharma, P. K.; Mishra, Ashutosh; Malviya, Varsha; Kame, Rashmi; Malviya, P. K.

2017-05-01

Synthesis of copper (II) complexes [CuL1L2X].nH2O, where n=1, 2,3 (X=Cl,Br,NO3) (L1is 2,2’-bipyridine and L2 is L-tyrosine) by the chemical root method. The XRD data for the samples have been recorded. EXAFS spectra have also been recorded at the K-edge of Cu using the dispersive beam line BL-8 at 2.5 Gev Indus-2 Synchrotron radiation source at RRCAT, Indore, India. XRD and EXAFS data have been analysed using the computer software. X-ray diffraction studies of all complexes indicate their crystalline nature. Lattice parameter, bond length, particle size have been determined from XRD data.

The adsorption of methanol and water on SAPO-34: in situ and ex situ X-ray diffraction studies

DEFF Research Database (Denmark)

Wragg, David S.; Johnsen, Rune; Norby, Poul

2010-01-01

The adsorption of methanol on SAPO-34 has been studied using a combination of in situ synchrotron powder X-ray diffraction to follow the process and ex situ high resolution powder diffraction to determine the structure. The unit cell volume of SAPO-34 is found to expand by 0.5% during methanol ad...

Time-resolved hard x-ray studies using third-generation synchrotron radiation sources (abstract)

International Nuclear Information System (INIS)

Mills, D.M.

1992-01-01

The third-generation, high-brilliance, synchrotron radiation sources currently under construction will usher in a new era of x-ray research in the physical, chemical, and biological sciences. One of the most exciting areas of experimentation will be the extension of static x-ray scattering and diffraction techniques to the study of transient or time-evolving systems. The high repetition rate, short-pulse duration, high-brilliance, variable spectral bandwidth, and large particle beam energies of these sources make them ideal for hard x-ray, time-resolved studies. The primary focus of this presentation will be on the novel instrumentation required for time-resolved studies such as optics which can increase the flux on the sample or disperse the x-ray beam, detectors and electronics for parallel data collection, and methods for altering the natural time structure of the radiation. This work is supported by the U.S. Department of Energy, BES-Materials Science, under Contract No. W-31-109-ENG-38

Synchrotron X-Ray Study of Melting in Submonolayer Ar and other Rare-Gas Films on Graphite

DEFF Research Database (Denmark)

McTague, J. P.; Als-Nielsen, Jens Aage; Bohr, Jakob

1982-01-01

Synchrotron x-ray diffraction studies of the (10) peak of Ar on the (001) surface of ZYX graphite show a sharp but continuous broadening of the Bragg peak with increasing temperature. Below a coverage of ∼ 1 Ar atom per six surface carbon atoms (ρ=1) the onset of this transition occurs...

Synchrotron-based X-ray microscopic studies for bioeffects of nanomaterials.

Science.gov (United States)

Zhu, Ying; Cai, Xiaoqing; Li, Jiang; Zhong, Zengtao; Huang, Qing; Fan, Chunhai

2014-04-01

There have been increasing interests in studying biological effects of nanomaterials, which are nevertheless faced up with many challenges due to the nanoscale dimensions and unique chemical properties of nanomaterials. Synchrotron-based X-ray microscopy, an advanced imaging technology with high spatial resolution and excellent elemental specificity, provides a new platform for studying interactions between nanomaterials and living systems. In this article, we review the recent progress of X-ray microscopic studies on bioeffects of nanomaterials in several living systems including cells, model organisms, animals and plants. We aim to provide an overview of the state of the art, and the advantages of using synchrotron-based X-ray microscopy for characterizing in vitro and in vivo behaviors and biodistribution of nanomaterials. We also expect that the use of a combination of new synchrotron techniques should offer unprecedented opportunities for better understanding complex interactions at the nano-biological interface and accounting for unique bioeffects of nanomaterials. Synchrotron-based X-ray microscopy is a non-destructive imaging technique that enables high resolution spatial mapping of metals with elemental level detection methods. This review summarizes the current use and perspectives of this novel technique in studying the biology and tissue interactions of nanomaterials. Copyright © 2014 Elsevier Inc. All rights reserved.

Crystallized solids characterization by X-ray diffraction

International Nuclear Information System (INIS)

Broll, N.

1996-01-01

This work deals with the crystallized solids characterization by X-ray diffraction. The powders diffraction principle is described. Then are given the different powders diffraction experimental methods. An X-ray diffraction device is essentially constituted of three parts: the X-rays source, the sample and the detector. The source is usually constituted by an X-rays tube whereas the sample can be fixed on a photographic chamber or put on a goniometer. The different photographic chambers which can be used (Debye-Scherrer, Seeman-Bohlin and Guinier) are described. The powders diffractometer the most used is a Bragg-Brentano focusing diffractometer because it allows to obtain very sharp spectral lines and an important diffracted intensity. The detectors which are the mainly used are the scintillation counters. The most important use in powders diffractometry is the identification of the different phases of a sample. The phases identification consists to compare the unknown sample spectrum at those of standard materials indexed until now. Two methods exist at present. They are explained and their limits in the phases search are given. Another use of the X-ray diffraction is the quantitative analysis. It consists to determine the concentrations of each crystal phases of a sample. The principles of these quantitative methods are given. The lattice parameters of a polycrystal material can be determined from its X-ray pattern too with a very high precision. The way to index powders patterns is given. The residual stresses of materials can also be estimated. The principle of this measured method is explained. It is at last possible to study from an X-ray pattern, the material grain orientations during the different steps of preparation and working. (O.M.). 13 refs., 19 figs., 1 tab

X-CHIP: an integrated platform for high-throughput protein crystallization and on-the-chip X-ray diffraction data collection

International Nuclear Information System (INIS)

Kisselman, Gera; Qiu, Wei; Romanov, Vladimir; Thompson, Christine M.; Lam, Robert; Battaile, Kevin P.; Pai, Emil F.; Chirgadze, Nickolay Y.

2011-01-01

The X-CHIP (X-ray Crystallography High-throughput Integrated Platform) is a novel microchip that has been developed to combine multiple steps of the crystallographic pipeline from crystallization to diffraction data collection on a single device to streamline the entire process. The X-CHIP (X-ray Crystallization High-throughput Integrated Platform) is a novel microchip that has been developed to combine multiple steps of the crystallographic pipeline from crystallization to diffraction data collection on a single device to streamline the entire process. The system has been designed for crystallization condition screening, visual crystal inspection, initial X-ray screening and data collection in a high-throughput fashion. X-ray diffraction data acquisition can be performed directly on-the-chip at room temperature using an in situ approach. The capabilities of the chip eliminate the necessity for manual crystal handling and cryoprotection of crystal samples, while allowing data collection from multiple crystals in the same drop. This technology would be especially beneficial for projects with large volumes of data, such as protein-complex studies and fragment-based screening. The platform employs hydrophilic and hydrophobic concentric ring surfaces on a miniature plate transparent to visible light and X-rays to create a well defined and stable microbatch crystallization environment. The results of crystallization and data-collection experiments demonstrate that high-quality well diffracting crystals can be grown and high-resolution diffraction data sets can be collected using this technology. Furthermore, the quality of a single-wavelength anomalous dispersion data set collected with the X-CHIP at room temperature was sufficient to generate interpretable electron-density maps. This technology is highly resource-efficient owing to the use of nanolitre-scale drop volumes. It does not require any modification for most in-house and synchrotron beamline systems and offers

X-CHIP: an integrated platform for high-throughput protein crystallization and on-the-chip X-ray diffraction data collection

Energy Technology Data Exchange (ETDEWEB)

Kisselman, Gera; Qiu, Wei; Romanov, Vladimir; Thompson, Christine M.; Lam, Robert [Ontario Cancer Institute, Princess Margaret Hospital, University Health Network, Toronto, Ontario M5G 2C4 (Canada); Battaile, Kevin P. [Argonne National Laboratory, Argonne, Illinois 60439 (United States); Pai, Emil F.; Chirgadze, Nickolay Y., E-mail: nchirgad@uhnresearch.ca [Ontario Cancer Institute, Princess Margaret Hospital, University Health Network, Toronto, Ontario M5G 2C4 (Canada); University of Toronto, Toronto, Ontario M5S 1A8 (Canada)

2011-06-01

The X-CHIP (X-ray Crystallography High-throughput Integrated Platform) is a novel microchip that has been developed to combine multiple steps of the crystallographic pipeline from crystallization to diffraction data collection on a single device to streamline the entire process. The X-CHIP (X-ray Crystallization High-throughput Integrated Platform) is a novel microchip that has been developed to combine multiple steps of the crystallographic pipeline from crystallization to diffraction data collection on a single device to streamline the entire process. The system has been designed for crystallization condition screening, visual crystal inspection, initial X-ray screening and data collection in a high-throughput fashion. X-ray diffraction data acquisition can be performed directly on-the-chip at room temperature using an in situ approach. The capabilities of the chip eliminate the necessity for manual crystal handling and cryoprotection of crystal samples, while allowing data collection from multiple crystals in the same drop. This technology would be especially beneficial for projects with large volumes of data, such as protein-complex studies and fragment-based screening. The platform employs hydrophilic and hydrophobic concentric ring surfaces on a miniature plate transparent to visible light and X-rays to create a well defined and stable microbatch crystallization environment. The results of crystallization and data-collection experiments demonstrate that high-quality well diffracting crystals can be grown and high-resolution diffraction data sets can be collected using this technology. Furthermore, the quality of a single-wavelength anomalous dispersion data set collected with the X-CHIP at room temperature was sufficient to generate interpretable electron-density maps. This technology is highly resource-efficient owing to the use of nanolitre-scale drop volumes. It does not require any modification for most in-house and synchrotron beamline systems and offers

Synchrotron-Radiation X-Ray Investigation of Li+/Na+ Intercalation into Prussian Blue Analogues

Directory of Open Access Journals (Sweden)

Yutaka Moritomo

2013-01-01

Full Text Available Prussian blue analogies (PBAs are promising cathode materials for lithium ion (LIB and sodium ion (SIB secondary batteries, reflecting their covalent and nanoporous host structure. With use of synchrotron-radiation (SR X-ray source, we investigated the structural and electronic responses of the host framework of PBAs against Li+ and Na+ intercalation by means of the X-ray powder diffraction (XRD and X-ray absorption spectroscopy (XAS. The structural investigation reveals a robust nature of the host framework against Li+ and Na+ intercalation, which is advantageous for the stability and lifetime of the batteries. The spectroscopic investigation identifies the redox processes in respective plateaus in the discharge curves. We further compare these characteristics with those of the conventional cathode materials, such as, LiCoO2, LiFePO4, and LiMn2O4.

X rays and condensed matter

International Nuclear Information System (INIS)

Daillant, J.

1997-01-01

After a historical review of the discovery and study of X rays, the various interaction processes between X rays and matter are described: Thomson scattering, Compton scattering, X-photon absorption through photoelectric effect, and magnetic scattering. X ray sources such as the European Synchrotron Radiation Facility (ESRF) are described. The various X-ray applications are presented: imagery such as X tomography, X microscopy, phase contrast; X-ray photoelectron spectroscopy and X-ray absorption spectroscopy; X-ray scattering and diffraction techniques

Experimental determination of bulk modulus of 14Å tobermorite using high pressure synchrotron X-ray diffraction

KAUST Repository

Oh, Jae Eun; Clark, Simon M.; Wenk, Hans-Rudolf; Monteiro, Paulo J.M.

2012-01-01

Using a diamond anvil cell, 14 Å tobermorite, a structural analogue of calcium silicate hydrates (C-S-H), was examined by high-pressure synchrotron X-ray diffraction up to 4.8 GPa under hydrostatic conditions. The bulk modulus of 14 Å tobermorite was calculated, K o = 47 GPa. Comparison of the current results with previous high pressure studies on C-S-H(I) indicates that: (1) the compression behavior of the lattice parameters a and b of 14 Å tobermorite and C-S-H(I) are very similar, implying that both materials may have very similar Ca-O layers, and also implying that an introduction of structural defects into the Ca-O layers may not substantially change in-plane incompressibility of the ab plane of 14 Å tobermorite; and (2) the bulk modulus values of 14 Å tobermorite and C-S-H(I) are dominated by the incompressibility of the lattice parameter c, which is directly related to the interlayer spacing composed of dreierketten silicate chains, interlayer Ca, and water molecules. © 2011 Elsevier Ltd. All rights reserved.

Experimental determination of bulk modulus of 14Å tobermorite using high pressure synchrotron X-ray diffraction

KAUST Repository

Oh, Jae Eun

2012-02-01

Using a diamond anvil cell, 14 Å tobermorite, a structural analogue of calcium silicate hydrates (C-S-H), was examined by high-pressure synchrotron X-ray diffraction up to 4.8 GPa under hydrostatic conditions. The bulk modulus of 14 Å tobermorite was calculated, K o = 47 GPa. Comparison of the current results with previous high pressure studies on C-S-H(I) indicates that: (1) the compression behavior of the lattice parameters a and b of 14 Å tobermorite and C-S-H(I) are very similar, implying that both materials may have very similar Ca-O layers, and also implying that an introduction of structural defects into the Ca-O layers may not substantially change in-plane incompressibility of the ab plane of 14 Å tobermorite; and (2) the bulk modulus values of 14 Å tobermorite and C-S-H(I) are dominated by the incompressibility of the lattice parameter c, which is directly related to the interlayer spacing composed of dreierketten silicate chains, interlayer Ca, and water molecules. © 2011 Elsevier Ltd. All rights reserved.

On the feasibility of establishing the provenance of Australian Aboriginal artefacts using synchrotron radiation X-ray diffraction and proton-induced X-ray emission

International Nuclear Information System (INIS)

Creagh, D.C.; Kubik, M.E.; Sterns, M.

2007-01-01

Museums and galleries in Australia have extensive collections of Aboriginal artefacts in their custody. In particular, the National Museum of Australia and the National Gallery of Australia are custodians of works of very considerable significance, in both cultural and financial terms. Art fraud can occur, documentation relating to artefacts can be mislaid, or the artefacts can be incorrectly filed. Because of this, it has become essential to establish protocols for the objective determination of the provenance of artefacts through scientific tests. For the work reported here we are concerned with the comparison of very small quantities of materials, paint scrapings from artefacts. Scrapings from artefacts of unknown provenance are compared with those from artefacts of known provenance, and the database established using an extended set of analytical techniques by Kubik. We describe here our use of synchrotron radiation X-ray diffraction (SR-XRD) to determine the mineral phase compositions of very small amounts of pigment material (<50 μg), and the use of PIXE to give their atomic compositions to a threshold level of 1 ppm for similar masses of material

Application of synchrotron radiation to X-ray interferometry

Energy Technology Data Exchange (ETDEWEB)

Hart, M [King' s Coll., London (UK). Wheatstone Physics Lab.

1980-05-01

X-ray interferometry has been attempted with synchrotron radiation at Hamburg and at Orsay. Experiments will start this year at the Storage Ring Source at Daresbury. This review covers work which has already been completed and outlines the likely trends in phase sensitive X-ray polarimetry, high resolution spectroscopy (including real and imaginary-part EXAFS) and novel experiments with many-beam-case interferometers.

Fast synchrotron X-ray tomography study of the rod packing structures

Energy Technology Data Exchange (ETDEWEB)

Zhang Xiaodan; Xia Chengjie; Sun Haohua; Wang Yujie [Department of Physics, Shanghai Jiao Tong University, 800 Dong Chuan Road, Shanghai 200240 (China)

2013-06-18

We present a fast synchrotron X-ray tomography study of the packing structures of rods under tapping. Utilizing the high flux of the X-rays generated from the third-generation synchrotron source, we can complete a tomography scan within several seconds, after which the three-dimensional (3D) packing structure can be obtained for the subsequent structural analysis. Due to the high-energy nature of the X-ray beam, special image processing steps including image phase-retrieval has been implemented. Overall, this study suggests the possibility of acquiring statistically significant static packing structures within a reasonable time scale using high-intensity X-ray sources.

100 years of discovery of X-ray diffraction

International Nuclear Information System (INIS)

Zhang Tao

2012-01-01

X-ray diffraction was discovered by Max von Laue a hundred years ago. Later, through the work of William H. Bragg and William L. Bragg, an experimental analysis method was developed to solve the structure of molecules at the atomic level. Over the past hundred years, science and technology has been dramatically changed by X-ray diffraction analysis, which has also undergone considerable development. The recent emergence of hard X-ray free electron lasers has provided a new dimension for X-ray diffraction analysis, promising even greater progress in the fields of physics, chemistry and biology. (author)

Using acoustic levitation in synchrotron based laser pump hard x-ray probe experiments

Science.gov (United States)

Hu, Bin; Lerch, Jason; Suthar, Kamlesh; Dichiara, Anthony

Acoustic levitation provides a platform to trap and hold a small amount of material by using standing pressure waves without a container. The technique has a potential to be used for laser pump x-ray probe experiments; x-ray scattering and laser distortion from the container can be avoided, sample consumption can be minimized, and unwanted chemistry that may occur at the container interface can be avoided. The method has been used at synchrotron sources for studying protein and pharmaceutical solutions using x-ray diffraction (XRD) and small angle x-ray scattering (SAXS). However, pump-probe experiments require homogeneously excited samples, smaller than the absorption depth of the material that must be held stably at the intersection of both the laser and x-ray beams. We discuss 1) the role of oscillations in acoustic levitation and the optimal acoustic trapping conditions for x-ray/laser experiments, 2) opportunities to automate acoustic levitation for fast sample loading and manipulation, and 3) our experimental results using SAXS to monitor laser induced thermal expansion in gold nanoparticles solution. We also performed Finite Element Analysis to optimize the trapping performance and stability of droplets ranging from 0.4 mm to 2 mm. Our early x-ray/laser demonstrated the potential of the technique for time-resolved X-ray science.

Diffracted X-ray tracking: new system for single molecular detection with X-rays

CERN Document Server

Sasaki, Y C; Adachi, S; Suzuki, Y; Yagi, N

2001-01-01

We propose a new X-ray methodology for direct observations of the behaviors of single molecular units in real time and real space. This new system, which we call Diffracted X-ray Tracking (DXT), monitors the Brownian motions of a single molecular unit by observations of X-ray diffracted spots from a nanocrystal, tightly bound to the individual single molecular unit in bio-systems. DXT does not determine any translational movements, but only orientational movements.

Diffracted X-ray tracking: new system for single molecular detection with X-rays

International Nuclear Information System (INIS)

Sasaki, Y.C.; Okumura, Y.; Adachi, S.; Suzuki, Y.; Yagi, N.

2001-01-01

We propose a new X-ray methodology for direct observations of the behaviors of single molecular units in real time and real space. This new system, which we call Diffracted X-ray Tracking (DXT), monitors the Brownian motions of a single molecular unit by observations of X-ray diffracted spots from a nanocrystal, tightly bound to the individual single molecular unit in bio-systems. DXT does not determine any translational movements, but only orientational movements

High-resolution X-ray diffraction with no sample preparation.

Science.gov (United States)

Hansford, G M; Turner, S M R; Degryse, P; Shortland, A J

2017-07-01

It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique allows high-quality X-ray diffraction analysis of samples that have not been prepared and is therefore completely non-destructive. The experimental technique was implemented on beamline B18 at the Diamond Light Source synchrotron in Oxfordshire, UK. The majority of the experiments in this study were performed with pre-characterized geological materials in order to elucidate the characteristics of this novel technique and to develop the analysis methods. Results are presented that demonstrate phase identification, the derivation of precise unit-cell parameters and extraction of microstructural information on unprepared rock samples and other sample types. A particular highlight was the identification of a specific polytype of a muscovite in an unprepared mica schist sample, avoiding the time-consuming and difficult preparation steps normally required to make this type of identification. The technique was also demonstrated in application to a small number of fossil and archaeological samples. Back-reflection EDXRD implemented in a high-resolution configuration shows great potential in the crystallographic analysis of cultural heritage artefacts for the purposes of scientific research such as provenancing, as well as contributing to the formulation of conservation strategies. Possibilities for moving the technique from the synchrotron into museums are discussed. The avoidance of the need to extract samples from high-value and rare objects is a highly significant advantage, applicable also in other potential research areas such as palaeontology, and the study of meteorites and planetary materials brought to Earth by sample-return missions.

Introducing the ARL X'Tra x-ray diffraction system

International Nuclear Information System (INIS)

Harris, L.

2002-01-01

Full text: The ARL X'Tra is a state-of-the-art solution for powder X-ray diffraction in a large range of applications such as pharmaceuticals and biosciences, chemicals, earth sciences, semi-conductors, metallurgy and ceramics. The X'Tra offers the latest technology in key diffraction components to produce a high performance instrument at an affordable price. This presentation examines some of the hardware and performance features of this instrument. Copyright (2002) Australian X-ray Analytical Association Inc

Quadrupole lamp furnace for high temperature (up to 2050 K) synchrotron powder x-ray diffraction studies in air in reflection geometry

International Nuclear Information System (INIS)

Sarin, P.; Yoon, W.; Jurkschat, K.; Zschack, P.; Kriven, W. M.

2006-01-01

A four-lamp thermal image furnace has been developed to conduct high temperature x-ray diffraction in reflection geometry on oxide ceramic powder samples in air at temperatures ≤2050 K using synchrotron radiation. A refractory crucible made of Pt20%Rh alloy was used as a specimen holder. A material with well characterized lattice expansion properties was used as an internal crystallographic thermometer to determine the specimen temperature and displacement. The performance of the apparatus was verified by measurement of the thermal expansion properties of CeO 2 , MgO, and Pt which were found to be within ±3% of the acceptable values. The advantages, limitations, and important considerations of the instrument developed are discussed

Generation of relativistic electron bunches in plasma synchrotron Gyrac-x for hard x-ray production

International Nuclear Information System (INIS)

Andreev, V.V.; Umnov, A.M.

2000-01-01

Experiment performed on plasma synchrotron Gyrac-X operating on synchrotron gyromagnetic autoresonance (SGA) is described. Gyrac-X is a compact plasma x-ray source in which kinetic energy of relativistic electrons obtained under SGA converts into x-ray by falling e-bunches on to a heavy metal target. The plasma synchrotron acts in a regime of a magnetic field pulse packet under constant level of microwave power. Experiments and numerical modeling of the process showed that such a regime allowed obtaining dense short lived relativistic electron bunches with average electron energy of 500 keV - 4.5 MeV. Parameters of the relativistic electron bunch (energy, density and volume) and dynamics of the electron bunches can be controlled by varying the parameters of the SGA process. Possibilities of x-ray intensity increase are also discussed

PRELIMINARY RESULTS IN SYNCHROTRON X-RAY DIFFRACTION MEASUREMENTS OF RUBBER COMPOSITES STRUCTURE BEFORE AND AFTER EXPOSURE TO HYDROGEN

Directory of Open Access Journals (Sweden)

Francesca Cosmi

2011-05-01

Full Text Available In future years, fuel cells are expected to represent a promising technology as a source of heat and electricity in buildings and of electrical power for vehicles, since fossil fuels are exhausting and significantly degrade air quality. It is well known that, when exposed to a hydrogen environment, hydrogen embrittlerment may affect materials such as iron and steel. But these are not the only materials that are used for hydrogen equipment. In particular, the rubber materials used for O–rings that seal high pressure hydrogen gas equipment show problems of internal fracture, called blister fracture, when the gas is rapidly decompressed. As many different kinds of fillers can be used, in this work we started to investigate the influence of the type of filler on the rubber composites structure, by means of X-ray diffraction measurements performed at the Elettra synchrotron radiation facility in Trieste. In this preliminary study, three kinds of samples were analyzed before and after exposure to hydrogen: Sulphur vulcanized EPDM, Peroxide vulcanized EPDM and Sulphur vulcanized NBR. While Peroxide vulcanized samples did not show significant differences in the diffraction pattern, changes could be detected in the cristalline form of Sulfure vulcanized rubber.

High-pressure powder X-ray diffraction at the turn of the century

International Nuclear Information System (INIS)

Paszkowicz, W.

2002-01-01

Studies at extreme pressures and temperatures are helpful for understanding the physical properties of the solid state, including such classes of materials as semiconductors, superconductors or minerals. This is connected with the opportunity of tuning the pressure by many orders of magnitude. Diamond-anvil and large-anvil pressure cells installed at dedicated synchrotron beamlines are efficient tools for examination of crystal structure, equation of state, compressibility and phase transitions. One of basic methods in such studies is powder diffraction. This review is devoted to methods of powder X-ray diffraction at high-pressures generated by devices installed at synchrotron radiation sources, in particular to the principles of operation of high-pressure-high-temperature cells. General information on high-pressure diffraction facilities installed at 11 synchrotron storage rings in the world is provided. Measurement aspects are considered, including (i) pressure generation and calibration, (ii) strain in the sample, the pressure marker and the pressure-transmitting medium and (iii) pressure and temperature distributions within the cells. Sources of interest in high-pressure diffraction studies (design of new materials, observation of new phenomena, confrontation of theory with experiment) are briefly discussed. Recent developments of high-pressure methods make that pressure becomes a variable playing a key role in investigation of condensed matter. The paper ends with some remarks on the possible future developments of the technique

X-ray diffraction analysis of rust layer on a weathering steel bridge with surface treatment using synchrotron radiation

International Nuclear Information System (INIS)

Yamashita, Masato; Hara, Shuichi; Kamimura, Takayuki; Miyuki, Hideaki; Sato, Masugu

2007-01-01

We have examined the structure of rust layer formed on a weathering steel bridge, to which the surface treatment, employing the effect of Cr 2 (SO 4 ) 3 sophisticatedly designed to form the protective goethite (α-FeOOH) rust layer which contains a certain amount of Cr, Cr-goethite, was applied in 1996, using X-ray diffraction at SPring-8 synchrotron radiation facility. It was shown that the formation of α-FeOOH was promoted and/or crystal growth of γ-FeOOH was suppressed by the surface treatment. The increase in the protective ability index (PAI) of the rust layer indicates that the protective goethite was predominantly formed under the effect of the surface treatment. In conclusion, it can be said that the surface treatment worked well to promote the formation of the protective goethite rust layer on the weathering steel bridge during the 10-year exposure. (author)

High-Pressure X-ray Diffraction Study of Tungsten Diselenide

International Nuclear Information System (INIS)

Selvi, E.; Aksoy, R.; Knudson, R.; Ma, Y.

2008-01-01

Synchrotron X-ray diffraction was used in conjunction with a diamond anvil cell to investigate the properties of a tungsten diselenide (WSe2) sample to 35.8 GPa at room temperature. By fitting the pressure-volume data to the third-order Birch-Murnaghan equation of state, the bulk modulus, K0T, of WSe2 was determined to be 72±1 GPa with its pressure derivative, K(prime) 0T , being 4.1±0.1. It was also found that the c-direction of the hexagonal structure is significantly more compressible than the a-direction. No phase transformation was clearly observed in the pressure range of our measurements.

Synchrotron X-ray Scattering of ZnO Nanorods: Periodic Ordering and Lattice Size

International Nuclear Information System (INIS)

Zhu, Z.; Andelman, T.; Yin, M.; Chen, T.; Ehrlich, S.; O'Brien, S.; Osgood, Jr. R.

2005-01-01

We demonstrate that synchrotron x-ray powder diffraction (XRD) is a powerful technique for studying the structure and self-organization of zinc-oxide nanostructures. Zinc-oxide nanorods were prepared by a solution-growth method that resulted in uniform nanorods with 2-nm diameter and lengths in the range 10-50 nm. These nanorods were structurally characterized by a combination of small-angle and wide-angle synchrotron XRD and transmission electron microscopy (TEM). Small-angle XRD and TEM were used to investigate nanorod self-assembly and the influence of surfactant/precursor ratio on self-assembly. Wide-angle XRD was used to study the evolution of nanorod growth as a function of synthesis time and surfactant/precursor ratio

X-ray diffraction analysis of residual stresses in alumina-chromium composites and comparison with numerical simulations

Energy Technology Data Exchange (ETDEWEB)

Geandier, G.; Weisbecker, P.; Denis, S.; Mocellin, A. [L.S.G.2M., UMR, CNRS/INPL, Ecole des Mines de Nancy, Nancy (France); Hazotte, A. [L.S.G.2M., UMR, CNRS/INPL, Ecole des Mines de Nancy, Nancy (France); LETAM, UMR, CNRS/Metz Univ., ISGMP, Metz (France); Lebrun, J.L. [L.P.M.I., ENSAM Angers, Angers (France); Elkaim, E. [L.U.R.E., Centre Univ. Paris-Sud, Orsay (France)

2002-07-01

Residual stresses in alumina chromium composites have been determined using X ray synchrotron diffraction at LURE. Results show that non-negligible residual stresses exist in the composites. Mean residual stresses calculated by finite element show discrepancies with experimental values that are discussed in relation with experimental difficulties and calculation assumptions. (orig.)

A X-ray diffraction analysis on constituent distribution of heavy rust layer formed on weathering steel using synchrotron radiation

International Nuclear Information System (INIS)

Hara, Shuichi

2008-01-01

A local structural analysis of heavy rust layers with large swelling and laminated layers formed on weathering steel bridges using synchrotron radiation X-ray diffraction (SR-XRD) in SPring-8 have been performed. The main constituent in average composition of the whole layer was spinel-type iron oxide [mainly Magnetite (Fe 3 O 4 )] and the mass ratio was 30-40 mass%. In contrast the mass ratio of spinel in its local parts, i.e., outer layer, inter-layer and inner layer position was not higher in common but the mass ratio of β-FeOOH was higher. Therefore it indicates that these heavy rust layers have been composed of many layers of spinel poor, rich and poor - cell (SPRaP-cell). Thus SR-XRD is useful for the analysis of the constituent distribution in the rust layer. (author)

Epitaxial clusters studied by synchrotron x-ray diffraction and scanning tunneling microscopy

DEFF Research Database (Denmark)

Nielsen, M.; Feidenhans'l, R.; Rasmussen, F.B.

1998-01-01

Nanoscale clusters are often formed during heteroepitaxial crystal growth. Misfit between the lattice parameter of the substrate and the adsorbate stimulates the formation of regular clusters with a characteristic size. The well-known "hut-clusters" formed during the growth of Ge on Si(001) are a...... similar to the "hut clusters". We demonstrate that X-ray diffraction in combination with scanning tunneling microscopy can be used to determine the fundamental properties of such clusters. (C) 1998 Elsevier Science B.V. All rights reserved....

Submicron X-ray diffraction

International Nuclear Information System (INIS)

MacDowell, Alastair; Celestre, Richard; Tamura, Nobumichi; Spolenak, Ralph; Valek, Bryan; Brown, Walter; Bravman, John; Padmore, Howard; Batterman, Boris; Patel, Jamshed

2000-01-01

At the Advanced Light Source in Berkeley the authors have instrumented a beam line that is devoted exclusively to x-ray micro diffraction problems. By micro diffraction they mean those classes of problems in Physics and Materials Science that require x-ray beam sizes in the sub-micron range. The instrument is for instance, capable of probing a sub-micron size volume inside micron sized aluminum metal grains buried under a silicon dioxide insulating layer. The resulting Laue pattern is collected on a large area CCD detector and automatically indexed to yield the grain orientation and deviatoric (distortional) strain tensor of this sub-micron volume. A four-crystal monochromator is then inserted into the beam, which allows monochromatic light to illuminate the same part of the sample. Measurement of diffracted photon energy allows for the determination of d spacings. The combination of white and monochromatic beam measurements allow for the determination of the total strain/stress tensor (6 components) inside each sub-micron sized illuminated volume of the sample

An x-ray microprobe using focussing optics with a synchrotron radiation source

International Nuclear Information System (INIS)

Thompson, A.C.; Underwood, J.H.; Wu, Y.; Giauque, R.D.

1989-01-01

An x-ray microprobe can be used to produce maps of the concentration of elements in a sample. Synchrotron radiation provides x-ray beams with enough intensity and collimation to make possible elemental images with femtogram sensitivity. The use of focussing x-ray mirrors made from synthetic multilayers with a synchrotron x-ray beam allows beam spot sizes of less than 10 μm /times/ 10 μm to be produced. Since minimal sample preparation is required and a vacuum environment is not necessary, there will be a wide variety of applications for such microprobes. 8 refs., 6 figs

Expression, purification, crystallization and preliminary X-ray diffraction analysis of Arabidopsis thaliana cyclophilin 38 (AtCyp38)

International Nuclear Information System (INIS)

Vasudevan, Dileep; Gopalan, Gayathri; He, Zengyong; Luan, Sheng; Swaminathan, Kunchithapadam

2005-01-01

Crystallization of Arabidopsis thaliana cyclophilin 38. The crystal diffracts X-rays to 2.5 Å resolution. AtCyp38 is one of the highly divergent multidomain cyclophilins from Arabidopsis thaliana. A recombinant form of AtCyp38 (residues 83–437) was expressed in Escherichia coli and purified to homogeneity. The protein was crystallized using the vapour-batch technique with PEG 6000 and t-butanol as precipitants. Crystals of recombinant AtCyp38 diffracted X-rays to better than 2.5 Å resolution at 95 K using a synchrotron-radiation source. The crystal belongs to the C-centred orthorhombic space group C222 1 , with unit-cell parameters a = 58.2, b = 95.9, c = 167.5 Å, and contains one molecule in the asymmetric unit. The selenomethionine derivative of the AtCyp38 protein was overexpressed, purified and crystallized in the same space group and data were collected to 3.5 Å at the NSLS synchrotron. The structure is being solved by the MAD method

Single-pulse x-ray diffraction using polycapillary optics for in situ dynamic diffraction

Energy Technology Data Exchange (ETDEWEB)

Maddox, B. R., E-mail: maddox3@llnl.gov; Akin, M. C., E-mail: akin1@llnl.gov; Teruya, A.; Hunt, D.; Hahn, D.; Cradick, J. [Lawrence Livermore National Laboratory, Livermore, California 94550 (United States); Morgan, D. V. [National Security Technologies LLC, Los Alamos, New Mexico 87544 (United States)

2016-08-15

Diagnostic use of single-pulse x-ray diffraction (XRD) at pulsed power facilities can be challenging due to factors such as the high flux and brightness requirements for diffraction and the geometric constraints of experimental platforms. By necessity, the x-ray source is usually positioned very close, within a few inches of the sample. On dynamic compression platforms, this puts the x-ray source in the debris field. We coupled x-ray polycapillary optics to a single-shot needle-and-washer x-ray diode source using a laser-based alignment scheme to obtain high-quality x-ray diffraction using a single 16 ns x-ray pulse with the source >1 m from the sample. The system was tested on a Mo sample in reflection geometry using 17 keV x-rays from a Mo anode. We also identified an anode conditioning effect that increased the x-ray intensity by 180%. Quantitative measurements of the x-ray focal spot produced by the polycapillary yielded a total x-ray flux on the sample of 3.3 ± 0.5 × 10{sup 7} molybdenum Kα photons.

Construction of a forensic soil database of the Hokkaido region in Japan by synchrotron radiation X-ray analysis

International Nuclear Information System (INIS)

Shirota, Yusuke; Hirao, Masataka; Abe, Yoshinari; Nakai, Izumi; Osaka, Keiichi; Itou, Masayoshi

2017-01-01

The purpose of the present study is to construct a nation-wide forensic soil database, which allows for the identification of soil evidence based on heavy element and heavy mineral signatures determined by two synchrotron radiation (SR) X-ray techniques, i.e., a high-energy synchrotron radiation X-ray fluorescence analysis and a synchrotron-radiation X-ray powder diffraction analysis, respectively. The heavy element and heavy mineral compositions of the stream sediments collected at 3024 points located all over Japan were measured by the two SR X-ray techniques. The present paper focuses on a regional characterization of the sediments collected from the Hokkaido areas. The concentrations of heavy elements and heavy minerals in the Hokkaido areas were visualized as maps that enable us to compare the heavy element and heavy mineral compositions with the geological context of the samples. Based on a hierarchical cluster analysis using the semi-quantitative compositions of the heavy minerals, we could successfully classify the sediments into six groups corresponding to their background geologies. A Bonferroni multiple comparison demonstrated that these six groups also have significant differences in the heavy element composition. From these examinations, we could demonstrate that detailed regional identification of unknown samples is possible by analyzing both heavy element and heavy mineral compositions of each sample. (author)

Stabilization of synchrotron radiation x-ray beam by MOSTAB

CERN Document Server

Kudo, T P; Tanida, H; Furukawa, Y; Hirono, T; Ishikawa, T; Nishino, Y

2003-01-01

Monochromator stabilization (MOSTAB) is a feedback control system to stabilize an x-ray beam of synchrotron radiation. It applies a feedback voltage to a piezo electric transducer attached to a double-crystal monochromator. We developed MOSTAB modules and examined their performances using SPring-8 beamlines. The x-ray beam position stabilization using MOSTAB was realized simultaneously with the x-ray beam intensity stabilization. As an example of its application, we performed EXAFS measurement with MOSTAB. (author)

Synchrotron x-ray methods in studies of thin organic film structure

International Nuclear Information System (INIS)

Gentle, I.

2002-01-01

Full text: In recent years, the study of the structures of organic films as thin as a single monolayer has been revolutionized by methods that take advantage of the characteristics of synchrotron radiation. In particular, the methods of grazing incidence X-ray diffraction (GIXD) and X-ray reflectivity have led to a number of valuable insights into structural aspects of thin films at molecular resolution. Our group has been studying films formed at the air/water interface as insoluble monolayers and subsequently transferred to solid substrates using either the vertical (Langmuir-Blodgett) or horizontal (Langmuir-Schaeffer) methods. The main aim of these experiments is to exert control over film structure in the direction parallel to the substrate surface. This is highly desirable in order to design devices that exploit the optical and electrooptical properties of functional materials, but is difficult to do. By varying the chemical structure of the film materials and controlling deposition conditions a degree of control is possible, but only using synchrotron methods can it be easily verified. We have also developed a novel method of rapidly collecting data from GIXD measurements by the application of area detection (imaging plates), which has made possible measurements of dynamic processes such as in-situ annealing. Such measurements are not possible using traditional scanning methods. One area of current interest is films composed of porphyrins as functional materials, either alone or as mixed films with fatty acids. We have been investigating ways of assembling porphyrins in such a way as to overcome the tendency to aggregate, and to produce patterning and ordered structures in the plane of the interface. Examples will be given of how film composition and deposition method affects the final structure, and of how X-ray methods can be used to elucidate both the structures and the mechanisms. Copyright (2002) Australian X-ray Analytical Association Inc

Crystal structure of fluorite-related Ln3SbO7 (Ln=La–Dy) ceramics studied by synchrotron X-ray diffraction and Raman scattering

International Nuclear Information System (INIS)

Siqueira, K.P.F.; Borges, R.M.; Granado, E.; Malard, L.M.; Paula, A.M. de; Moreira, R.L.; Bittar, E.M.; Dias, A.

2013-01-01

Ln 3 SbO 7 (Ln=La, Pr, Nd, Sm, Eu, Gd, Tb and Dy) ceramics were synthesized by solid-state reaction in optimized conditions of temperature and time to yield single-phase ceramics. The crystal structures of the obtained ceramics were investigated by synchrotron X-ray diffraction, second harmonic generation (SHG) and Raman scattering. All samples exhibited fluorite-type orthorhombic structures with different oxygen arrangements as a function of the ionic radius of the lanthanide metal. For ceramics with the largest ionic radii (La–Nd), the ceramics crystallized into the Cmcm space group, while the ceramics with intermediate and smallest ionic radii (Sm–Dy) exhibited a different crystal structure belonging to the same space group, described under the Ccmm setting. The results from SHG and Raman scattering confirmed these settings and ruled out any possibility for the non-centrosymmetric C222 1 space group describing the structure of the small ionic radii ceramics, solving a recent controversy in the literature. Besides, the Raman modes for all samples are reported for the first time, showing characteristic features for each group of samples. - Graphical abstract: Raman spectrum for La 3 SbO 7 ceramics showing their 22 phonon modes adjusted through Lorentzian lines. According to synchrotron X-ray diffraction and Raman scattering, this material belongs to the space group Cmcm. - Highlights: • Ln 3 SbO 7 ceramics belonging to the space groups Cmcm and Ccmm are synthesized. • SXRD, SHG and Raman scattering confirmed the orthorhombic structures. • Ccmm instead of C222 1 is the correct one based on SHG and Raman data

Measurements of internal stresses in bond coating using high energy x-rays from synchrotron radiation source

CERN Document Server

Suzuki, K; Akiniwa, Y; Nishio, K; Kawamura, M; Okado, H

2002-01-01

Thermal barrier coating (TBC) techniques enable high temperature combustion of turbines made of Ni-base alloy. TBC is made of zirconia top coating on NiCoCrAlY bond coating. The internal stresses in the bond coating play essential role in the delamination or fracture of TBC in service. With the X-rays from laboratory equipments, it is impossible to measure nondestructively the internal stress in the bond coating under the top coating. synchrotron radiations with a high energy and high brightness have a large penetration depth as compared with laboratory X-rays. Using the high energy X-rays from the synchrotron radiation, it is possible to measure the internal stress in the bond coating through the top coating. In this study, the furnace, which can heat a specimen to 1473 K, was developed for the stress measurement of the thermal barrier coatings. The internal stresses in the bond coating were measured at the room temperature, 773 K, 1073 K and 1373 K by using the 311 diffraction from Ni sub 3 Al with about 73...

Adaptive chemistry of bifunctional gold nanoparticles at the air/water interface. A synchrotron X-ray study of giant amphiphiles

DEFF Research Database (Denmark)

Nørgaard, K.; Weygand, M.J.; Kjær, K.

2004-01-01

A series of ligand stabilized gold nanoparticles with diameters close to 3 nm were studied as Langmuir monolayers at the air/water interface by synchrotron X-ray diffraction and reflectivity. Alkylthiols with different length and/or terminal functional group (hydrophilic or hydrophobic) were intr...

Instrumentation of x-ray diffraction and materials research on the National Synchrotron Light Source. Final report

International Nuclear Information System (INIS)

Liedl, G.L.

1984-11-01

MATRIX was organized in 1980 to formulate a research team to design and construct a beam line at NSLS for x-ray diffraction studies of materials. A versatile system was designed to allow a full range of experimental capabilities for wide angle x-ray scattering experiments including surface diffraction studies. The design and construction of the system has been completed. Testing of parts of the system was completed at CHESS and with x-ray sources or other equipment at member institutions. Installation of the beam line at NSLS is in progress and will proceed in parallel with the commissioning of the x-ray ring at NSLS. Full operation of the beam line is expected to be ready by December 1, 1984 being limited only by the source power of NSLS at that time. Useful experiments could be started if the power is at least 2 GeV and 100ma. The MATRIX beam line was one of the first x-ray beam lines to see light in the beam line in early spring of 1984. In July of 1984, the MATRIX beam line as the first port at NSLS to have a monochromatic beam and to scan part of the spectrum from the source. As part of this contract, six publications have resulted from the various projects. Three publications are concerned directly with the beam line and/or its operation while the other three publications are the result of research associated with the project

Three-dimensional monochromatic x-ray computed tomography using synchrotron radiation

Science.gov (United States)

Saito, Tsuneo; Kudo, Hiroyuki; Takeda, Tohoru; Itai, Yuji; Tokumori, Kenji; Toyofuku, Fukai; Hyodo, Kazuyuki; Ando, Masami; Nishimura, Katsuyuki; Uyama, Chikao

1998-08-01

We describe a technique of 3D computed tomography (3D CT) using monochromatic x rays generated by synchrotron radiation, which performs a direct reconstruction of a 3D volume image of an object from its cone-beam projections. For the development, we propose a practical scanning orbit of the x-ray source to obtain complete 3D information on an object, and its corresponding 3D image reconstruction algorithm. The validity and usefulness of the proposed scanning orbit and reconstruction algorithm were confirmed by computer simulation studies. Based on these investigations, we have developed a prototype 3D monochromatic x-ray CT using synchrotron radiation, which provides exact 3D reconstruction and material-selective imaging by using the K-edge energy subtraction technique.

Systematic investigation of lard polymorphism using combined DSC and time-resolved synchrotron X-ray diffraction

NARCIS (Netherlands)

Kalnin, D.J.E.; Lesieur, P.; Artzner, F.; Keller, G.; Ollivon, M.

2005-01-01

The polymorphic behavior of lard was systematically investigated by differential scanning calorimetry (DSC) while simultaneously monitoring the formation of the different crystal forms with X-ray diffraction (XRDT). To interpret the complex polymorphic evolution of the sample analyzed by regular

Synchrotron X-ray diffraction studies of the incommensurate phase of a spin-Peierls system CuGeO3 in strong magnetic fields

International Nuclear Information System (INIS)

Narumi, Yasuo; Katsumata, Koichi; Tanaka, Yoshikazu; Ishikawa, Tetsuya; Kitamura, Hideo; Hara, Toru; Tanaka, Takashi; Tamasaku, Kenji; Tabata, Yoshikazu; Kimura, Shojiro; Nakamura, Tetsuya; Yabashi, Makina; Goto, Shunji; Ohashi, Haruhiko; Takeshita, Kunikazu; Ohata, Toru; Matsushita, Tomohiro; Bizen, Teruhiko; Shimomura, Susumu; Matsuda, Masaaki

2004-01-01

Synchrotron X-ray diffraction measurements on a spin-Peierls material CuGeO 3 in applied magnetic fields, H, up to 15 T are made. We find that the temperature, T, dependence of the incommensurate Bragg peak at a lower H is quite different from that at a higher H. At sufficiently high fields, we find that the lattice incommensurability, δι, is almost independent of T, while at H slightly above the critical field = 12.25 T for the commensurate to incommensurate transition, δι decreases with increasing T. We interpret that this finding is due to a stabilization of the incommensurate state by a strong magnetic field which suppresses thermal fluctuations. (author)

Use of synchrotron-based diffraction-enhanced imaging for visualization of soft tissues in invertebrates

International Nuclear Information System (INIS)

Rao, Donepudi V.; Swapna, Medasani; Cesareo, Roberto; Brunetti, Antonio; Zhong, Zhong; Akatsuka, Takao; Yuasa, Tetsuya; Takeda, Tohoru; Gigante, Giovanni E.

2010-01-01

Images of terrestrial and marine invertebrates (snails and bivalves) have been obtained by using an X-ray phase-contrast imaging technique, namely, synchrotron-based diffraction-enhanced imaging. Synchrotron X-rays of 20, 30 and 40 keV were used, which penetrate deep enough into animal soft tissues. The phase of X-ray photons shifts slightly as they traverse an object, such as animal soft tissue, and interact with its atoms. Biological features, such as shell morphology and animal physiology, have been visualized. The contrast of the images obtained at 40 keV is the best. This optimum energy provided a clear view of the internal structural organization of the soft tissue with better contrast. The contrast is higher at edges of internal soft-tissue structures. The image improvements achieved with the diffraction-enhanced imaging technique are due to extinction, i.e., elimination of ultra-small-angle scattering. They enabled us to identify a few embedded internal shell features, such as the origin of the apex, which is the firmly attached region of the soft tissue connecting the umbilicus to the external morphology. Diffraction-enhanced imaging can provide high-quality images of soft tissues valuable for biology.

Use of synchrotron-based diffraction-enhanced imaging for visualization of soft tissues in invertebrates

Energy Technology Data Exchange (ETDEWEB)

Rao, Donepudi V., E-mail: donepudi_venkateswararao@rediffmail.co [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Swapna, Medasani, E-mail: medasanisw@gmail.co [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Cesareo, Roberto; Brunetti, Antonio [Istituto di Matematica e Fisica, Universita degli Studi di Sassari, Via Vienna 2, 07100 Sassari (Italy); Zhong, Zhong [National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States); Akatsuka, Takao; Yuasa, Tetsuya [Department of Bio-System Engineering, Faculty of Engineering, Yamagata University, Yonezawa-shi, Yamagata-992-8510 (Japan); Takeda, Tohoru [Allied Health Science, Kitasato University 1-15-1 Kitasato, Sagamihara, Kanagawa 228-8555 (Japan); Gigante, Giovanni E. [Dipartimento di Fisica, Universita di Roma, La Sapienza, 00185 Roma (Italy)

2010-09-15

Images of terrestrial and marine invertebrates (snails and bivalves) have been obtained by using an X-ray phase-contrast imaging technique, namely, synchrotron-based diffraction-enhanced imaging. Synchrotron X-rays of 20, 30 and 40 keV were used, which penetrate deep enough into animal soft tissues. The phase of X-ray photons shifts slightly as they traverse an object, such as animal soft tissue, and interact with its atoms. Biological features, such as shell morphology and animal physiology, have been visualized. The contrast of the images obtained at 40 keV is the best. This optimum energy provided a clear view of the internal structural organization of the soft tissue with better contrast. The contrast is higher at edges of internal soft-tissue structures. The image improvements achieved with the diffraction-enhanced imaging technique are due to extinction, i.e., elimination of ultra-small-angle scattering. They enabled us to identify a few embedded internal shell features, such as the origin of the apex, which is the firmly attached region of the soft tissue connecting the umbilicus to the external morphology. Diffraction-enhanced imaging can provide high-quality images of soft tissues valuable for biology.

Three-dimensional x-ray diffraction detection and visualization

International Nuclear Information System (INIS)

Allahkarami, Masoud; Hanan, Jay C

2014-01-01

A new method of sensing and analyzing three-dimensional (3D) x-ray diffraction (XRD) cones was introduced. Using a two-dimensional area detector, a sequence of frames was collected while moving the detector away from the sample with small equally spaced steps and keeping all other parameters constant. A 3D dataset was created from the subsequent frames. The 3D x-ray diffraction (XRD 3 ) pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer and 2D x-ray diffraction (XRD 2 ). The present work discusses some fundamentals about XRD 3 , such as the data collection method, 3D visualization, diffraction data interpretation and potential applications of XRD 3 . (paper)

Elucidating oxygen electrocatalysis with synchrotron X-rays: PEM fuel cells and electrolyzers

DEFF Research Database (Denmark)

Pedersen, Anders Filsøe

In this thesis electrocatalysts for the oxygen reduction reaction (ORR) and the oxygen evolution reaction (OER) have been investigated using synchrotron based X-ray diffraction and X-ray absorption spectroscopy methods. The catalysts are based on Pt alloys and RuO2 for ORR and OER, respectively...... stability measurements showed that the in-plane compression relaxes during the first 2000-3000 cycles, explaining the loss of activity primarily in this range of cycling. For OER mass-selected nanoparticles of metallic Ru and thermally oxidized RuO2 were fabricated. Both materials are highly active for OER......, although the metallic Ru nanoparticles exceptionally so. However this comes as a trade-off in stability, as the metallic particles dissolves rapidly at OER conditions. In an in-situ XAS experiment the oxidation state of the nanoparticles were tracked as a function of potential. It was found...

Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques.

Science.gov (United States)

Gueninchault, N; Proudhon, H; Ludwig, W

2016-11-01

Multi-modal characterization of polycrystalline materials by combined use of three-dimensional (3D) X-ray diffraction and imaging techniques may be considered as the 3D equivalent of surface studies in the electron microscope combining diffraction and other imaging modalities. Since acquisition times at synchrotron sources are nowadays compatible with four-dimensional (time lapse) studies, suitable mechanical testing devices are needed which enable switching between these different imaging modalities over the course of a mechanical test. Here a specifically designed tensile device, fulfilling severe space constraints and permitting to switch between X-ray (holo)tomography, diffraction contrast tomography and topotomography, is presented. As a proof of concept the 3D characterization of an Al-Li alloy multicrystal by means of diffraction contrast tomography is presented, followed by repeated topotomography characterization of one selected grain at increasing levels of deformation. Signatures of slip bands and sudden lattice rotations inside the grain have been shown by means of in situ topography carried out during the load ramps, and diffraction spot peak broadening has been monitored throughout the experiment.

Thermal management of next-generation contact-cooled synchrotron x-ray mirrors

Energy Technology Data Exchange (ETDEWEB)

Khounsary, A.

1999-10-29

In the past decade, several third-generation synchrotrons x-ray sources have been constructed and commissioned around the world. Many of the major problems in the development and design of the optical components capable of handling the extremely high heat loads of the generated x-ray beams have been resolved. It is expected, however, that in the next few years even more powerful x-ray beams will be produced at these facilities, for example, by increasing the particle beam current. In this paper, the design of a next generation of synchrotron x-ray mirrors is discussed. The author shows that the design of contact-cooled mirrors capable of handing x-ray beam heat fluxes in excess of 500 W/mm{sup 2} - or more than three times the present level - is well within reach, and the limiting factor is the thermal stress rather then thermally induced slope error.

In situ x-ray diffraction of an arc weld showing the phase transformations of Ti and Fe as a function of position in the weld performed at a synchrotron

International Nuclear Information System (INIS)

Wong, J.; Elmer, J.W.; Waide, P.A.

1994-01-01

The synchrotron x-ray source provides a unique opportunity to observe open-quotes in-situclose quotes processes. The formation of the open-quotes short-livedclose quotes intermediate species, Ta 2 C, during the combustion synthesis of TaC, has been observed and reported by monitoring the Bragg diffraction peaks of the reactants and products. Similarly, the synthesis of the ferroelectric material, BaTiO 3 , and subsequent phase transformation from cubic to tetragonal have also been investigated. These experiments would not have been possible without the high incident x-ray flux available at a synchrotron source. The physical and mechanical properties of a weld join are highly independent upon the thermal history of the weld. Factors such as grain size, which increases with annealing, influence the tensile strength of the weld. This work presents the results of an investigation of the phase changes in two materials, titanium and stainless steel, which occur during the welding process. 4 refs., 3 figs

The T2 phase in the Nb–Si–B system studied by ab initio calculations and synchrotron X-ray diffraction

International Nuclear Information System (INIS)

Joubert, J.-M.; Colinet, C.; Rodrigues, G.; Suzuki, P.A.; Nunes, C.A.; Coelho, G.C.; Tedenac, J.-C.

2012-01-01

The solid solution based on Nb 5 Si 3 (Cr 5 B 3 structure type, D8 l , tI32, I4/mcm, No140, a=6.5767 Å, c=11.8967 Å) in the Nb–Si–B system was studied from the structural and thermodynamic point of view both experimentally and by ab initio calculations. Rietveld refinement of powder X-ray synchrotron data allowed to determine the boron to silicon substitution mechanism and the structural parameters. Ab initio calculations of different ordered compounds and selected disordered alloys allowed to obtain in addition to the enthalpy of formation of the solution, substitution mechanism and structural parameters which are in excellent agreement with the experimental data. The stability of the phase is discussed. - Graphial abstract: Valence-charge electron localization function in the z=0 plane of the D8 l structure for the ordered compound Nb 5 SiB 2 . Highlights: ► Coupling between ab initio data and experimental results from synchrotron powder diffraction. ► Excellent agreement between the two techniques for the site occupancies and internal coordinates. ► Explanation of the phase stability up to Nb 5 SiB 2 .

Synchrotron X-ray diffraction studies of phase transitions and mechanical properties of nanocrystalline materials at high pressure

International Nuclear Information System (INIS)

Prilliman, Gerald Stephen

2003-01-01

The behavior of nanocrystals under extreme pressure was investigated using synchrotron x-ray diffraction. A major part of this investigation was the testing of a prototype synchrotron endstation on a bend magnet beamline at the Advanced Light Source for high pressure work using a diamond anvil cell. The experiments conducted and documented here helped to determine issues of efficiency and accuracy that had to be resolved before the construction of a dedicated ''super-bend'' beamline and endstation. The major conclusions were the need for a cryo-cooled monochromator and a fully remote-controllable pressurization system which would decrease the time to change pressure and greatly reduce the error created by the re-placement of the diamond anvil cell after each pressure change. Two very different types of nanocrystal systems were studied, colloidal iron oxide (Fe 2 O 3 ) and thin film TiN/BN. Iron oxide nanocrystals were found to have a transition from the γ to the α structure at a pressure strongly dependent on the size of the nanocrystals, ranging from 26 GPa for 7.2 nm nanocrystals to 37 GPa for 3.6 nm nanocrystals. All nanocrystals were found to remain in the α structure even after release of pressure. The transition pressure was also found, for a constant size (5.7 nm) to be strongly dependent on the degree of aggregation of the nanocrystals, increasing from 30 GPa for completely dissolved nanocrystals to 45 GPa for strongly aggregated nanocrystals. Furthermore, the x-ray diffraction pattern of the pressure induced α phase demonstrated a decrease in intensity for certain select peaks. Together, these observations were used to make a complete picture of the phase transition in nanocrystalline systems. The size dependence of the transition was interpreted as resulting from the extremely high surface energy of the α phase which would increase the thermodynamic offset and thereby increase the kinetic barrier to transition that must be overridden with pressure

Synchrotron X-ray diffraction studies of phase transitions and mechanical properties of nanocrystalline materials at high pressure

Energy Technology Data Exchange (ETDEWEB)

Prilliman, Stephen Gerald [Univ. of California, Berkeley, CA (United States)

2003-01-01

The behavior of nanocrystals under extreme pressure was investigated using synchrotron x-ray diffraction. A major part of this investigation was the testing of a prototype synchrotron endstation on a bend magnet beamline at the Advanced Light Source for high pressure work using a diamond anvil cell. The experiments conducted and documented here helped to determine issues of efficiency and accuracy that had to be resolved before the construction of a dedicated ''super-bend'' beamline and endstation. The major conclusions were the need for a cryo-cooled monochromator and a fully remote-controllable pressurization system which would decrease the time to change pressure and greatly reduce the error created by the re-placement of the diamond anvil cell after each pressure change. Two very different types of nanocrystal systems were studied, colloidal iron oxide (Fe₂O₃) and thin film TiN/BN. Iron oxide nanocrystals were found to have a transition from the γ to the α structure at a pressure strongly dependent on the size of the nanocrystals, ranging from 26 GPa for 7.2 nm nanocrystals to 37 GPa for 3.6 nm nanocrystals. All nanocrystals were found to remain in the α structure even after release of pressure. The transition pressure was also found, for a constant size (5.7 nm) to be strongly dependent on the degree of aggregation of the nanocrystals, increasing from 30 GPa for completely dissolved nanocrystals to 45 GPa for strongly aggregated nanocrystals. Furthermore, the x-ray diffraction pattern of the pressure induced α phase demonstrated a decrease in intensity for certain select peaks. Together, these observations were used to make a complete picture of the phase transition in nanocrystalline systems. The size dependence of the transition was interpreted as resulting from the extremely high surface energy of the α phase which would increase the thermodynamic offset and thereby increase the kinetic barrier to transition

X-ray phase contrast imaging: From synchrotrons to conventional sources

International Nuclear Information System (INIS)

Olivo, A.; Castelli, E.

2014-01-01

Phase-based approaches can revolutionize X-ray imaging and remove its main limitation: poor image contrast arising from low attenuation differences. They exploit the unit decrement of the real part of the refractive index, typically 1000 times larger than the imaginary part driving attenuation. This increases the contrast of all details, and enables the detection of features classically considered 'X-ray invisible'. Following pioneering experiments dating back to the mid-sixties, X-ray phase contrast imaging 'exploded' in the mid-nineties, when third generation synchrotron sources became more widely available. Applications were proposed in fields as diverse as material science, palaeontology, biology, food science, cultural heritage preservation, and many others. Among these applications, medicine has been constantly considered the most important; among medical applications, mammography is arguably the one that attracted most attention. Applications to mammography were pioneered by the SYRMEP (SYnchrotron Radiation for MEdical Physics) group in Trieste, which was already active in the area through a combination of innovative ways to do imaging at synchrotrons and development of novel X-ray detectors. This pioneering phase led to the only clinical experience of phase contrast mammography on human patients, and spawned a number of ideas as to how these advances could be translated into clinical practice.

Structural refinement and extraction of hydrogen atomic positions in polyoxymethylene crystal based on the first successful measurements of 2-dimensional high-energy synchrotron X-ray diffraction and wide-angle neutron diffraction patterns of hydrogenated and deuterated species

International Nuclear Information System (INIS)

Tashiro, Kohji; Hanesaka, Makoto; Ohhara, Takashi; Kurihara, Kazuo; Tamada, Taro; Kuroki, Ryota; Fujiwara, Satoru; Ozeki, Tomoji; Kitano, Toshiaki; Nishu, Takashi; Tanaka, Ichiro; Niimura, Nobuo

2007-01-01

2-Dimensional X-ray and neutron diffraction patterns have been successfully measured for deuterated and hydrogenated polyoxymethylene (POM) samples obtained by γ-ray induced solid-state polymerization reaction. More than 700 reflections were collected from the X-ray diffraction data at -150degC by utilizing a high-energy synchrotron X-ray beam at SPring-8, Japan, from which the crystal structure of POM has been refined thoroughly including the extraction of hydrogen atomic positions at clearly seen in the difference Fourier synthesis map. As the first trial the nonuniform (9/5) helical model was analyzed with the reliability factor (R factor) 6.9%. The structural analysis was made also using the X-ray reflections of about 400 observed at room temperature (R 8.8%), and the thermal parameters of constituent atoms were compared between the low and high temperatures to discuss the librational thermal motion of the chains. The 2-dimensional neutron diffraction data, collected for the deuterated and hydrogenated POM samples using an imaging plate system specifically built-up for neutron scattering experiment, have allowed us to pick up the D and H atomic positions clearly in the Fourier synthesis maps. Another possible model, (29/16) helix, which was proposed by several researches, has been also investigated on the basis of the X-ray diffraction data at -150degC. The direct method succeeded in extracting this (29/16) model straightforwardly. The R factor was 8.6%, essentially the same as that of (9/5) helical model. This means that the comparison of the diffraction intensity between the data collected from the full-rotation X-ray diffraction pattern and the intensity calculated for both the (9/5) and (29/16) models cannot be used for the unique determination of the superiority of the model, (9/5) or (29/16) helix. However, we have found the existence of 001 and 002 reflections which give the longer repeating period 55.7 A. Besides there observed a series of meridional

Capture and X-ray diffraction studies of protein microcrystals in a microfluidic trap array

Energy Technology Data Exchange (ETDEWEB)

Lyubimov, Artem Y. [Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Murray, Thomas D. [University of California, Berkeley, CA 94720 (United States); Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); Koehl, Antoine [Stanford University, Stanford, CA 94305 (United States); Araci, Ismail Emre [Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Uervirojnangkoorn, Monarin; Zeldin, Oliver B. [Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Cohen, Aina E.; Soltis, S. Michael; Baxter, Elizabeth L. [SLAC National Accelerator Laboratory, Stanford, CA 94305 (United States); Brewster, Aaron S.; Sauter, Nicholas K. [Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States); Brunger, Axel T., E-mail: brunger@stanford.edu [Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Stanford University, Stanford, CA 94305 (United States); Berger, James M., E-mail: brunger@stanford.edu [Johns Hopkins University School of Medicine, Baltimore, MD 21205 (United States); Stanford University, Stanford, CA 94305 (United States)

2015-04-01

A microfluidic platform has been developed for the capture and X-ray analysis of protein microcrystals, affording a means to improve the efficiency of XFEL and synchrotron experiments. X-ray free-electron lasers (XFELs) promise to enable the collection of interpretable diffraction data from samples that are refractory to data collection at synchrotron sources. At present, however, more efficient sample-delivery methods that minimize the consumption of microcrystalline material are needed to allow the application of XFEL sources to a wide range of challenging structural targets of biological importance. Here, a microfluidic chip is presented in which microcrystals can be captured at fixed, addressable points in a trap array from a small volume (<10 µl) of a pre-existing slurry grown off-chip. The device can be mounted on a standard goniostat for conducting diffraction experiments at room temperature without the need for flash-cooling. Proof-of-principle tests with a model system (hen egg-white lysozyme) demonstrated the high efficiency of the microfluidic approach for crystal harvesting, permitting the collection of sufficient data from only 265 single-crystal still images to permit determination and refinement of the structure of the protein. This work shows that microfluidic capture devices can be readily used to facilitate data collection from protein microcrystals grown in traditional laboratory formats, enabling analysis when cryopreservation is problematic or when only small numbers of crystals are available. Such microfluidic capture devices may also be useful for data collection at synchrotron sources.

High-energy synchrotron X-ray radiography of shock-compressed materials

Science.gov (United States)

Rutherford, Michael E.; Chapman, David J.; Collinson, Mark A.; Jones, David R.; Music, Jasmina; Stafford, Samuel J. P.; Tear, Gareth R.; White, Thomas G.; Winters, John B. R.; Drakopoulos, Michael; Eakins, Daniel E.

2015-06-01

This presentation will discuss the development and application of a high-energy (50 to 250 keV) synchrotron X-ray imaging method to study shock-compressed, high-Z samples at Beamline I12 at the Diamond Light Source synchrotron (Rutherford-Appleton Laboratory, UK). Shock waves are driven into materials using a portable, single-stage gas gun designed by the Institute of Shock Physics. Following plate impact, material deformation is probed in-situ by white-beam X-ray radiography and complimentary velocimetry diagnostics. The high energies, large beam size (13 x 13 mm), and appreciable sample volumes (~ 1 cm3) viable for study at Beamline I12 compliment existing in-house pulsed X-ray capabilities and studies at the Dynamic Compression Sector. The authors gratefully acknowledge the ongoing support of Imperial College London, EPSRC, STFC and the Diamond Light Source, and AWE Plc.

In-situ studies of the recrystallization process of CuInS2 thin films by energy dispersive X-ray diffraction

International Nuclear Information System (INIS)

Thomas, D.; Mainz, R.; Rodriguez-Alvarez, H.; Marsen, B.; Abou-Ras, D.; Klaus, M.; Genzel, Ch.; Schock, H.-W.

2011-01-01

Recrystallization processes during the sulfurization of CuInS 2 (CIS) thin films have been studied in-situ using energy dispersive X-ray diffraction (EDXRD) with synchrotron radiation. In order to observe the recrystallization isolated from other reactions occurring during film growth, Cu-poor, small grained CIS layers covered with CuS on top were heated in a vacuum chamber equipped with windows for synchrotron radiation in order to analyze the grain growth mechanism within the CIS layer. In-situ monitoring of the grain size based on diffraction line profile analysis of the CIS-112 reflection was utilized to interrupt the recrystallization process at different points. Ex-situ studies by electron backscatter diffraction (EBSD) and energy dispersive X-ray spectroscopy (EDX) performed on samples of intermediate recrystallization states reveal that during the heat treatment Cu and In interdiffuse inside the layer indicating the importance of the mobility of these two elements during CuInS 2 grain growth.

Thin film characterisation by advanced X-ray diffraction techniques

International Nuclear Information System (INIS)

Cappuccio, G.; Terranova, M.L.

1996-09-01

The Fifth School on X-ray diffraction from polycrystalline materials was devoted to thin film characterization by advanced X-ray diffraction techniques. Twenty contributions are contained in this volume; all twenty are recorded in the INIS Database. X-ray diffraction is known to be a powerful analytical tool for characterizing materials and understanding their structural features. The aim of these articles is to illustrate the fundamental contribution of modern diffraction techniques (grazing incidence, surface analysis, standing waves, etc.) to the characterization of thin and ultra-thin films, which have become important in many advanced technologies

Fast photoconductor CdTe detectors for synchrotron x-ray studies

International Nuclear Information System (INIS)

Yoo, Sung Shik; Faurie, J.P.; Huang Qiang; Rodricks, B.

1993-09-01

The Advanced Photon Source will be that brightest source of synchrotron x-rays when it becomes operational in 1996. During normal operation, the ring will be filled with 20 bunches of positrons with an interbunch spacing of 177 ns and a bunch width of 119 ps. To perform experiments with x-rays generated by positrons on these time scales one needs extremely high speed detectors. To achieve the necessary high speed, we are developing MBE-grown CdTe-base photoconductive position sensitive array detectors. The arrays fabricated have 64 pixels with a gap of 100 μm between pixels. The high speed response of the devices was tested using a short pulse laser. X-ray static measurements were performed using an x-ray tube and synchrotron radiation to study the device's response to flux and wavelength changes. This paper presents the response of the devices to some of these tests and discusses different physics aspects to be considered when designing high speed detectors

Multiple x-ray diffraction simulation and applications

International Nuclear Information System (INIS)

Costa, C.A.B.S. da.

1989-09-01

A computer program (MULTX) was implemented for simulation X-ray multiple diffraction diagrams in Renninger geometries. The program uses the X-ray multiple diffraction theory for imperfect crystals. The iterative calculation of the intensities is based on the Taylor series general term, and the primary beam power expansion is given as function of the beam x penetration in the crystal surface. This development allows to consider the simultaneous interaction of the beams involved in the multiple diffraction phenomenon. The simulated diagrams are calculated point-to-point and the tests for the Si and GaAs presented good reproduction of the experimental diagrams for different primary reflections. (L.C.J.A.)

CCD-based X-ray detectors for X-ray diffraction studies

International Nuclear Information System (INIS)

Ito, K.; Amemiya, Y.

1999-01-01

CCD-based X-ray detectors are getting to be used for X-ray diffraction studies especially in the studies where real time (automated) measurements and time-resolved measurements are required. Principles and designs of two typical types of CCD-based detectors are described; one is ths system in which x-ray image intensifiers are coupled to maximize the detective quantum efficiency for time-resolved measurements, and the other is the system in which tapered optical fibers are coupled for the reduction of the image into the CCD, which is optimized for automated measurements for protein crystallography. These CCD-based X-ray detectors have an image distortion and non-uniformity of response to be corrected by software. Correction schemes which we have developed are also described. (author)

Perfect-crystal x-ray optics to treat x-ray coherence

International Nuclear Information System (INIS)

Yamazaki, Hiroshi; Ishikawa, Tetsuya

2007-01-01

X-ray diffraction of perfect crystals, which serve as x-ray monochromator and collimator, modifies coherence properties of x-ray beams. From the time-dependent Takagi-Taupin equations that x-ray wavefields obey in crystals, the reflected wavefield is formulated as an integral transform of a general incident wavefield with temporal and spatial inhomogeneity. A reformulation of rocking-curve profiles from the field solution of the Takagi-Taupin equations allows experimental evaluation of the mutual coherence function of x-ray beam. The rigorous relationship of the coherence functions between before and after reflection clarifies how the coherence is transferred by a crystal. These results will be beneficial to developers of beamline optics for the next generation synchrotron sources. (author)

The one- and two-coordinate x-ray detectors

International Nuclear Information System (INIS)

Aulchenko, V.M.; Baru, S.E.; Khabakhpashev, A.G.; Savinov, G.A.

1992-01-01

The Institute of Nuclear Physics has designed and fabricated one- and two-coordinate x-ray detectors since 1975. For photon detection multiwire proportional chambers that operate in direct pulse count mode are employed. The characteristics of the detectors allow successful use of them for a wide range of diffractive x-ray structure studies, including studies of dynamics of structure variation (x-ray diffractive movies) and measurements at synchrotron radiation channels

Comparison of a CCD and an APS for soft X-ray diffraction

International Nuclear Information System (INIS)

Stewart, Graeme; Bates, R; Blue, A; Maneuski, D; Clark, A; Turchetta, R; Dhesi, S S; Marchal, J; Steadman, P; Tartoni, N

2011-01-01

We compare a new CMOS Active Pixel Sensor (APS) to a Princeton Instruments PIXIS-XO: 2048B Charge Coupled Device (CCD) with soft X-rays tested in a synchrotron beam line at the Diamond Light Source (DLS). Despite CCDs being established in the field of scientific imaging, APS are an innovative technology that offers advantages over CCDs. These include faster readout, higher operational temperature, in-pixel electronics for advanced image processing and reduced manufacturing cost. The APS employed was the Vanilla sensor designed by the MI3 collaboration and funded by an RCUK Basic technology grant. This sensor has 520 x 520 square pixels, of size 25 μm on each side. The sensor can operate at a full frame readout of up to 20 Hz. The sensor had been back-thinned, to the epitaxial layer. This was the first time that a back-thinned APS had been demonstrated at a beam line at DLS. In the synchrotron experiment soft X-rays with an energy of approximately 708 eV were used to produce a diffraction pattern from a permalloy sample. The pattern was imaged at a range of integration times with both sensors. The CCD had to be operated at a temperature of -55°C whereas the Vanilla was operated over a temperature range from 20°C to -10°C. We show that the APS detector can operate with frame rates up to two hundred times faster than the CCD, without excessive degradation of image quality. The signal to noise of the APS is shown to be the same as that of the CCD at identical integration times and the response is shown to be linear, with no charge blooming effects. The experiment has allowed a direct comparison of back thinned APS and CCDs in a real soft x-ray synchrotron experiment.

Comparison of a CCD and an APS for soft X-ray diffraction

Science.gov (United States)

Stewart, Graeme; Bates, R.; Blue, A.; Clark, A.; Dhesi, S. S.; Maneuski, D.; Marchal, J.; Steadman, P.; Tartoni, N.; Turchetta, R.

2011-12-01

We compare a new CMOS Active Pixel Sensor (APS) to a Princeton Instruments PIXIS-XO: 2048B Charge Coupled Device (CCD) with soft X-rays tested in a synchrotron beam line at the Diamond Light Source (DLS). Despite CCDs being established in the field of scientific imaging, APS are an innovative technology that offers advantages over CCDs. These include faster readout, higher operational temperature, in-pixel electronics for advanced image processing and reduced manufacturing cost. The APS employed was the Vanilla sensor designed by the MI3 collaboration and funded by an RCUK Basic technology grant. This sensor has 520 x 520 square pixels, of size 25 μm on each side. The sensor can operate at a full frame readout of up to 20 Hz. The sensor had been back-thinned, to the epitaxial layer. This was the first time that a back-thinned APS had been demonstrated at a beam line at DLS. In the synchrotron experiment soft X-rays with an energy of approximately 708 eV were used to produce a diffraction pattern from a permalloy sample. The pattern was imaged at a range of integration times with both sensors. The CCD had to be operated at a temperature of -55°C whereas the Vanilla was operated over a temperature range from 20°C to -10°C. We show that the APS detector can operate with frame rates up to two hundred times faster than the CCD, without excessive degradation of image quality. The signal to noise of the APS is shown to be the same as that of the CCD at identical integration times and the response is shown to be linear, with no charge blooming effects. The experiment has allowed a direct comparison of back thinned APS and CCDs in a real soft x-ray synchrotron experiment.

X-ray diffraction

International Nuclear Information System (INIS)

Einstein, J.R.; Wei, C.H.

1982-01-01

We have been interested in structural elucidation by x-ray diffraction of compounds of biological interest. Understanding exactly how atoms are arranged in three-dimensional arrays as molecules can help explain the relationship between structure and functions. The species investigated may vary in size and shape; our recent studies included such diverse substances as antischistosomal drugs, a complex of cadmium with nucleic acid base, nitrate salts of adenine, and proteins

Development of compact synchrotron light source LUNA for x-ray lithography

International Nuclear Information System (INIS)

Takahashi, M.; Mandai, S.; Hoshi, Y.; Kohno, Y.

1992-01-01

A compact synchrotron light source LUNA has been developed by Ishikawajima-Harima Heavy Industries Co., Ltd. (IHI), especially for x-ray lithography. It consists of a 45-MeV linac as an electron injector and an 800-MeV synchrotron. The peak wavelength of synchrotron radiation is around 10 A. The installation of LUNA was completed in April 1989 at the Tsuchiura Facility of IHI. The synchrotron radiation was first observed in December 1989. A stored beam current of 50 mA at 800 MeV and a lifetime over 1 h have been achieved. At present, experiments are still continuing to increase the stored current and the lifetime. X-ray lithography testing is scheduled to begin in a clean room in this facility. This paper describes the outline of LUNA and the present status

Cloning, expression, purification, crystallization and preliminary X-ray diffraction analysis of the regulator AcrR from Escherichia coli

International Nuclear Information System (INIS)

Li, Ming; Qiu, Xi; Su, Chih-Chia; Long, Feng; Gu, Ruoyu; McDermott, Gerry; Yu, Edward W.

2006-01-01

The transcriptional regulator AcrR from Escherichia coli has been cloned, overexpressed, purified and crystallized and X-ray diffraction data have been collected to a resolution of 2.5 Å. This paper describes the cloning, expression, purification and preliminary X-ray data analysis of the AcrR regulatory protein. The Escherichia coli AcrR is a member of the TetR family of transcriptional regulators. It regulates the expression of the AcrAB multidrug transporter. Recombinant AcrR with a 6×His tag at the C-terminus was expressed in E. coli and purified by metal-affinity chromatography. The protein was crystallized using hanging-drop vapor diffusion. X-ray diffraction data were collected from cryocooled crystals at a synchrotron light source. The best crystal diffracted to 2.5 Å. The space group was determined to be P3 2 , with unit-cell parameters a = b = 46.61, c = 166.16 Å

X-ray diffraction device comprising cooling medium connections provided on the x-ray tube

NARCIS (Netherlands)

1996-01-01

An X-ray diffraction device comprises a water-cooled X-ray tube which exhibits a line focus as well as, after rotation through 90 DEG , a point focus. Contrary to customary X-ray tubes, the cooling water is not supplied via the housing (12) in which the X-ray tube is mounted, but the cooling water

Phase and Chemical Composition Analysis on Neolithic Painted Ceramics Sherds Using Synchrotron Radiation X-Ray Powder Diffraction (SRXPD)

International Nuclear Information System (INIS)

Constantinescu, B.

2003-01-01

Full text: Synchrotron Radiation X-ray Powder Diffraction studies were performed at the wiggler beamline 1711 of MAX II Synchrotron accelerator from Lund, Sweden, in the frame of EU FPV Access to Large Scale Facilities programme. Diffraction data were collected using radiation of wavelength 1.36 A, which was detected by a Brucker system with a Smart 1000 CCD detector. The main goal of our studies was to distinguish different clays and mineral pigments of various Neolithic pottery-producing centres on Romanian territory in relation with possible inter-regional trade route connections. As main results we can mention: - identification of black pigment composition from Cucuteni (Northern Moldavia), Ariusd (South-Eastern Transylvania) and Cris-Starcevo (Oltenia) type pottery (VI - IV Millennia B. Chr.) as a combination of jacobsite, bixbyite (Manganese oxides), magnetite and goethite (Iron oxides) originary from North Moldova mineral deposits of Iacobeni (150 km up on the river Bistritza from analyzed Cucuteni archaeological sites), and as a combination of pyrolusite, magnetite and hematite for Cris-Starcevo samples, probably from local clay (enriched in Mn-Fe oxides) - identification of white pigment composition as calcite (CaCO3) for Cris- Starcevo culture sites from Central Transylvania (from the local abundant chalk deposits) and as calcium silicates mixed with illite (K, H2))Al2[(H2O, OH)2]AlSi3O10 for Cucuteni culture sites - identification of read-brown pigment composition as various mixtures of hematite - goethite - magnetite, all of local provenance - identification of all examined sherds as having local provenance for the clay The main conclusion is that during Neolithic period, the pottery workshops, largely extended on Romanian territory, used local clays but traded black mineral pigments across the Carpathian mountains (Cucuteni and Ariusd areas are separated by these mountains by easily crossed by passes along small rivers)

Characterization of Metalloproteins and Biomaterials by X-ray Absorption Spectroscopy and X-ray Diffraction

DEFF Research Database (Denmark)

Frankær, Christian Grundahl

This thesis presents thework on combining complementary X-rays techniques for studying the structures of proteins and other biomaterials, and consists of three different projects: (i) Characterization of protein powders with X-ray powder diffraction (XRPD). (ii) The combination of X-ray...... crystallography and X-ray absorption spectroscopy (XAS) applied to studying different hexameric insulin conformations. (iii) The structures of polymorphs of strontium ranelate and the distribution of strontium in bone tissue. A procedure for fast identification and verification of protein powders using XRPD...... was correction for disordered bulk-solvent, but also correction for background and optimization of unit cell parameters have to be taken into account. A sample holder was designed for collecting powder diffraction data on a standard laboratory X-ray powder diffractometer. The background was reduced by use...

New Insights into the Relationship Between Network Structure and Strain Induced Crystallization in Unvolcanized Natural Rubber by Synchrotron X-ray Diffraction

International Nuclear Information System (INIS)

Toki, S.; Hsiao, B.; Amnuaypornsri, S.; Sakdapipanich, J.

2009-01-01

The relationship between the network structure and strain-induced crystallization in un-vulcanized as well as vulcanized natural rubbers (NR) and synthetic poly-isoprene rubbers (IR) was investigated via synchrotron wide-angle X-ray diffraction (WAXD) technique. It was found that the presence of a naturally occurring network structure formed by natural components in un-vulcanized NR significantly facilitates strain-induced crystallization and enhances modulus and tensile strength. The stress-strain relation in vulcanized NR is due to the combined effect of chemical and naturally occurring networks. The weakness of naturally occurring network against stress and temperature suggests that vulcanized NR has additional relaxation mechanism due to naturally occurring network. The superior mechanical properties in NR compared with IR are mainly due to the existence of naturally occurring network structure.

Structure solution from powder neutron and x-ray diffraction data: getting the best of both worlds

International Nuclear Information System (INIS)

Hunter, B.A.

2000-01-01

Full text: Powder diffraction methods have traditionally been used in three main areas: phase identification and quantification, lattice parameter determination and structure refinement. Until recently structure solution has been the almost exclusive domain of single crystal diffraction methods, predominantly using x-rays. The increasing use of synchrotron and neutron sources, and the unrelenting advances in computing hardware and software means that powder methods are challenging single crystal methods as a practical method for structure solution, especially when single crystal method can not be applied. It is known that structural refinements from a known starting structure using combined X-ray and neutron data sets are capable of providing highly accurate structures. Likewise, using combined x-ray and neutron powder diffraction data in the structure solution process should also be a powerful technique, although to date no one is pursuing this methodology. This paper present examples of solutions to the problem. Namely we are using high resolution powder X-ray and neutron methods to solve the structures of molecular materials and minerals, then refining the structures using both sets of data. In this way we exploit the advantages of both methods while minimising the disadvantages. We present our solution for a small amino acid structure, a metalorganic and a mineral structure

A synchrotron-based X-ray exposure station for radiation biology experiments

International Nuclear Information System (INIS)

Thompson, A.C.; Blakely, E.A.; Bjornstad, K.A.; Chang, P.Y.; Rosen, C.J.; Schwarz, R.I.

2007-01-01

Synchrotron X-ray sources enable radiation biology experiments that are difficult with conventional sources. A synchrotron source can easily deliver a monochromatic, tunable energy, highly collimated X-ray beam of well-calibrated intensity. An exposure station at beamline 10.3.1 of the Advanced Light Source (ALS) has been developed which delivers a variable energy (5-20 keV) X-ray fan beam with very sharp edges (10-90% in less than 3 μm). A series of experiments have been done with a four-well slide where a stripe (100 μm widex18 mm long) of cells in each well has been irradiated and the dose varied from well to well. With this facility we have begun a series of experiments to study cells adjacent to irradiated cells and how they respond to the damage of their neighbors. Initial results have demonstrated the advantages of using synchrotron radiation for these experiments

A synchrotron-based X-ray exposure station for radiation biology experiments

Energy Technology Data Exchange (ETDEWEB)

Thompson, A.C. [Division of Life Sciences, Lawrence Berkeley National Laboratory, Bld. 50A-6120, Berkeley, CA 94720 (United States)], E-mail: acthompson@lbl.gov; Blakely, E.A.; Bjornstad, K.A. [Division of Life Sciences, Lawrence Berkeley National Laboratory, Bld. 50A-6120, Berkeley, CA 94720 (United States); Chang, P.Y. [Division of Life Sciences, Lawrence Berkeley National Laboratory, Bld. 50A-6120, Berkeley, CA 94720 (United States); SRI International, Menlo Park, CA (United States); Rosen, C.J.; Schwarz, R.I. [Division of Life Sciences, Lawrence Berkeley National Laboratory, Bld. 50A-6120, Berkeley, CA 94720 (United States)

2007-11-11

Synchrotron X-ray sources enable radiation biology experiments that are difficult with conventional sources. A synchrotron source can easily deliver a monochromatic, tunable energy, highly collimated X-ray beam of well-calibrated intensity. An exposure station at beamline 10.3.1 of the Advanced Light Source (ALS) has been developed which delivers a variable energy (5-20 keV) X-ray fan beam with very sharp edges (10-90% in less than 3 {mu}m). A series of experiments have been done with a four-well slide where a stripe (100 {mu}m widex18 mm long) of cells in each well has been irradiated and the dose varied from well to well. With this facility we have begun a series of experiments to study cells adjacent to irradiated cells and how they respond to the damage of their neighbors. Initial results have demonstrated the advantages of using synchrotron radiation for these experiments.

LAMBDA 2M GaAs—A multi-megapixel hard X-ray detector for synchrotrons

Science.gov (United States)

Pennicard, D.; Smoljanin, S.; Pithan, F.; Sarajlic, M.; Rothkirch, A.; Yu, Y.; Liermann, H. P.; Morgenroth, W.; Winkler, B.; Jenei, Z.; Stawitz, H.; Becker, J.; Graafsma, H.

2018-01-01

Synchrotrons can provide very intense and focused X-ray beams, which can be used to study the structure of matter down to the atomic scale. In many experiments, the quality of the results depends strongly on detector performance; in particular, experiments studying dynamics of samples require fast, sensitive X-ray detectors. "LAMBDA" is a photon-counting hybrid pixel detector system for experiments at synchrotrons, based on the Medipix3 readout chip. Its main features are a combination of comparatively small pixel size (55 μm), high readout speed at up to 2000 frames per second with no time gap between images, a large tileable module design, and compatibility with high-Z sensors for efficient detection of higher X-ray energies. A large LAMBDA system for hard X-ray detection has been built using Cr-compensated GaAs as a sensor material. The system is composed of 6 GaAs tiles, each of 768 by 512 pixels, giving a system with approximately 2 megapixels and an area of 8.5 by 8.5 cm2. While the sensor uniformity of GaAs is not as high as that of silicon, its behaviour is stable over time, and it is possible to correct nonuniformities effectively by postprocessing of images. By using multiple 10 Gigabit Ethernet data links, the system can be read out at the full speed of 2000 frames per second. The system has been used in hard X-ray diffraction experiments studying the structure of samples under extreme pressure in diamond anvil cells. These experiments can provide insight into geological processes. Thanks to the combination of high speed readout, large area and high sensitivity to hard X-rays, it is possible to obtain previously unattainable information in these experiments about atomic-scale structure on a millisecond timescale during rapid changes of pressure or temperature.

Chemical Mapping of Paleontological and Archeological Artifacts with Synchrotron X-Rays

Science.gov (United States)

Bergmann, Uwe; Manning, Phillip L.; Wogelius, Roy A.

2012-07-01

The application of the recently developed synchrotron rapid scanning X-ray fluorescence (SRS-XRF) technique to the mapping of large objects is the focus of this review. We discuss the advantages of SRS-XRF over traditional systems and the use of other synchrotron radiation (SR) techniques to provide corroborating spectroscopic and diffraction analyses during the same analytical session. After reviewing routine techniques used to analyze precious specimens, we present several case studies that show how SR-based methods have been successfully applied in archeology and paleontology. For example, SRS-XRF imaging of a seventh-century Qur'ān palimpsest and an overpainted original opera score from Luigi Cherubini is described. We also review the recent discovery of soft-tissue residue in fossils of Archaeopteryx and an ancient reptile, as well as work that has successfully resolved the remnants of pigment in Confuciusornis sanctus, a 120-million-year-old fossil of the oldest documented bird with a fully derived avian beak.

High pressure study of nanostructured Cu2Sb by X-ray Diffraction, Extended X-ray Absorption fine structure and Raman measurements

International Nuclear Information System (INIS)

Souza, Sergio Michielon de; Triches, Daniela Menegon; Lima, Joao Cardoso de; Polian, Alain

2016-01-01

Full text: Nanostructured tetragonal Cu 2 Sb was prepared by mechanical alloying and its stability was studied as a function of pressure using synchrotron X-ray diffraction (XRD) Extended X-Ray Absorption Fine Structure (EXAFS) and Raman spectroscopy. The high pressure XRD data were collected at 0.6, 1.1, 2.2, 3.4, 5.0, 7.1, 8.0, 9.9, 14.8, 18.7, 23.2, 29.3 and 40.6 GPa in the ELETTRA synchrotron (Italy) with λ = 0.68881 Å. The high pressure EXAFS measurements were carried out in the Soleil synchrotron (France) in 0.6, 1.8, 3.0, 4.5, 6.1, 8.0, 10.3, 12.7, 15.5, 18.0, 19.0, 20.0, 22.1, 23.9, 26.3 and 29.4 GPa and the high pressure Raman spectroscopy in the Institut de Mineralogie et de Physique des Milieux Condenses (France) collected at 0.1, 1.6, 3.7, 6.7, 11.2, 15.1, 19.4, 24.5, 30.8, 36.3, 41.3 and 44.5 GPa. The results show high structural and optical phase stability. The moduli bulk and its derivatives were obtained by using the Birch-Murnaghan equation of states to the XRD and EXAFS results. The evolution of the Raman modes and the bulk moduli were used to obtain the Grueneisen parameters. (author)

Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing

International Nuclear Information System (INIS)

Yu, Cun; Aoun, Bachir; Cui, Lishan; Liu, Yinong; Yang, Hong; Jiang, Xiaohua; Cai, Song; Jiang, Daqiang; Liu, Zunping; Brown, Dennis E.; Ren, Yang

2016-01-01

Microstructure evolution of a cold-drawn NiTi shape memory alloy wire was investigated by means of in-situ synchrotron high-energy X-ray diffraction during continuous heating. The cold-drawn wire contained amorphous regions and nano-crystalline domains in its microstructure. Pair distribution function analysis revealed that the amorphous regions underwent structural relaxation via atomic rearrangement when heated above 100 °C. The nano-crystalline domains were found to exhibit a strong cold work induced lattice strain anisotropy along 〈111〉, which coincides with the crystallographic fiber orientation of the domains along the wire axial direction. The lattice strain anisotropy systematically decreased upon heating above 200 °C, implying a structural recovery. Crystallization of the amorphous phase led to a broadening of the angular distribution of 〈111〉 preferential orientations of grains along the axial direction as relative to the original 〈111〉 axial fiber texture of the nanocrystalline domains produced by the severe cold wire drawing deformation.

X-ray photoelectron spectroscopy, high-resolution X-ray diffraction ...

Indian Academy of Sciences (India)

the crystalline quality through full-width at half-maximum values. .... angular divergence of ∆α = 12 arc sec. X-rays generated from the monochromator were diffracted from (0 0 6) LiNbO3 atomic planes with the (+, −, −, +, +) geometry. [8].

Crystallization and preliminary X-ray diffraction study of recombinant ribokinase from Thermus Species 2.9

Energy Technology Data Exchange (ETDEWEB)

Abramchik, Yu. A. [Russian Academy of Sciences, Shemyakin–Ovchinnikov Institute of Bioorganic Chemistry (Russian Federation); Timofeev, V. I., E-mail: tostars@mail.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics,” (Russian Federation); Muravieva, T. I.; Esipov, R. S., E-mail: espiov@mx.ibch.ru [Russian Academy of Sciences, Shemyakin–Ovchinnikov Institute of Bioorganic Chemistry (Russian Federation); Kuranova, I. P., E-mail: inna@ns.crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography of Federal Scientific Research Centre “Crystallography and Photonics,” (Russian Federation)

2016-11-15

Ribokinase from a thermophilic strain of Thermus species 2.9 belonging to the carbohydrate ribokinase family (EC 2.7.1.15) was isolated, purified, and crystallized. The crystallization conditions were found by the vapor-diffusion technique and were then optimized to apply the capillary counter-diffusion technique. The X-ray diffraction data set was collected from the crystals, which were grown by the counter-diffusion technique, at the SPring-8 synchrotron radiation facility to 2.87 Å resolution. The crystals belong to sp. gr. P12{sub 1}1 and have the following unit-cell parameters: a = 81.613 Å, b = 156.132 Å, c = 87.714 Å, α = γ = 90°, β = 103.819°. The X-ray diffraction data set is suitable for determining the three-dimensional structure of the protein by the molecular-replacement method.

Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode

OpenAIRE

Lai, X; Roberts, KJ; Avanci, LH; Cardoso, LP; Sasaki, JM

2003-01-01

The X-ray multiple diffraction technique using synchrotron radiation is applied in the preliminary study of the habit modification of KDP samples as induced by incorporation of the trivalent transition metal cation Mn3+. High-resolution Renninger scans of pure and doped KDP were carried out using 400 as the primary reflection, echoing the fact that these impurity species were segregated in the {100} growth sector. The analysis of the Renninger scans of the doped KDP crystals is consistent wit...

Femtosecond X-ray diffraction from two-dimensional protein crystals

Directory of Open Access Journals (Sweden)

Matthias Frank

2014-03-01

Full Text Available X-ray diffraction patterns from two-dimensional (2-D protein crystals obtained using femtosecond X-ray pulses from an X-ray free-electron laser (XFEL are presented. To date, it has not been possible to acquire transmission X-ray diffraction patterns from individual 2-D protein crystals due to radiation damage. However, the intense and ultrafast pulses generated by an XFEL permit a new method of collecting diffraction data before the sample is destroyed. Utilizing a diffract-before-destroy approach at the Linac Coherent Light Source, Bragg diffraction was acquired to better than 8.5 Å resolution for two different 2-D protein crystal samples each less than 10 nm thick and maintained at room temperature. These proof-of-principle results show promise for structural analysis of both soluble and membrane proteins arranged as 2-D crystals without requiring cryogenic conditions or the formation of three-dimensional crystals.

Characterization of a Test for Invasive Breast Cancer Using X-ray Diffraction of Hair - Results of a Clinical Trial

Directory of Open Access Journals (Sweden)

Gary L. Corino

2009-11-01

Full Text Available Objective: To assess the performance of a test for breast cancer utilizing synchrotron x-ray diffraction analysis of scalp hair from women undergoing diagnostic radiology assessment. Design and Setting: A double-blinded clinical trial of women who attended diagnostic radiology clinics in Australia. Patients: 1796 women referred for diagnostic radiology, with no previous history of cancer. Main Outcome Measures: Sensitivity, specificity and accuracy of the hair test analysis compared to the gold standard of imaging followed by biopsy where indicated. Results: The hair-based assay had an overall accuracy of >77% and a negative predictive value of 99%. For all women, the sensitivity of both mammography and x-ray diffraction alone was 64%, but when used together the sensitivity rose to 86%. The sensitivity of the hair test for women under the age of 70 was 74%. Conclusion: In this large population trial the association between the presence of breast cancer and an altered hair fibre X-ray diffraction pattern previously reported has been confirmed. It appears that mammography and X-ray diffraction of hair detect different populations of breast cancers, and are synergistic when used together.

Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-dimensional energy-dispersive detector.

Science.gov (United States)

Abboud, A; Kirchlechner, C; Keckes, J; Conka Nurdan, T; Send, S; Micha, J S; Ulrich, O; Hartmann, R; Strüder, L; Pietsch, U

2017-06-01

The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.

X-ray optics, a vital aspect of work with synchrotron radiation

International Nuclear Information System (INIS)

Bilderback, D.H.

1986-01-01

The kind of optical components that have been developed over the centuries to make use of visible light won't work for x-rays. New ways must be found to manipulate the much shorter-wavelength x-ray beams to produce effects similar to those achieved with such familiar devices as mirrors, lenses, prisms, and gratings. This is the province of the field of x-ray optics. One challenge is to design optical elements that can focus, disperse, or reflect beams in the x-ray region of the electromagnetic spectrum, where wavelengths are about a thousand times shorter than those in the region of visible light. A second problem is encountered in using the intense, high-energy x-radiation from a synchrotron: how to make the desired beam accessible to a user who is conducting an experiment in a shielded enclosure many meters away from the synchrotron storage ring. Depending on the application, one might want to pick out a single wavelength from the broad spectrum available from the synchrotron, or isolate a narrow band of wavelengths. Then the beam must be collimated. When samples to be exposed are of millimeter dimension or smaller, it may be desirable to increase the intensity by focusing the x-ray beam horizontally and vertically. All these manipulations are analogous to those done with visible light, but the shape and form of the optical components can be quite different

X-ray absorption microtomography (microCT) and small beam diffraction mapping of sea urchin teeth.

Science.gov (United States)

Stock, S R; Barss, J; Dahl, T; Veis, A; Almer, J D

2002-07-01

Two noninvasive X-ray techniques, laboratory X-ray absorption microtomography (microCT) and X-ray diffraction mapping, were used to study teeth of the sea urchin Lytechinus variegatus. MicroCT revealed low attenuation regions at near the tooth's stone part and along the carinar process-central prism boundary; this latter observation appears to be novel. The expected variation of Mg fraction x in the mineral phase (calcite, Ca(1-x)Mg(x)CO(3)) cannot account for all of the linear attenuation coefficient decrease in the two zones: this suggested that soft tissue is localized there. Transmission diffraction mapping (synchrotron X-radiation, 80.8 keV, 0.1 x 0.1mm(2) beam area, 0.1mm translation grid, image plate area detector) simultaneously probed variations in 3-D and showed that the crystal elements of the "T"-shaped tooth were very highly aligned. Diffraction patterns from the keel (adaxial web) and from the abaxial flange (containing primary plates and the stone part) differed markedly. The flange contained two populations of identically oriented crystal elements with lattice parameters corresponding to x=0.13 and x=0.32. The keel produced one set of diffraction spots corresponding to the lower x. The compositions were more or less equivalent to those determined by others for camarodont teeth, and the high Mg phase is expected to be disks of secondary mineral epitaxially related to the underlying primary mineral element. Lattice parameter gradients were not noted in the keel or flange. Taken together, the microCT and diffraction results indicated that there was a band of relatively high protein content, of up to approximately 0.25 volume fraction, in the central part of the flange and paralleling its adaxial and abaxial faces. X-ray microCT and microdiffraction data used in conjunction with protein distribution data will be crucial for understanding the properties of various biocomposites and their mechanical functions.

Exploring the behavior of molybdenum diboride (MoB2): A high pressure x-ray diffraction study

International Nuclear Information System (INIS)

Liu, Pingping; Peng, Fang; Yin, Shuai; Liu, Fangming; Wang, Qiming; Zhu, Xuhui; Wang, Pei; He, Duanwei; Liu, Jing

2014-01-01

Investigation of the equation of state of molybdenum diboride (MoB 2 ) has been performed to 24.1 GPa using synchrotron radiation angle-dispersive x-ray diffraction techniques (ADXRD) in a diamond anvil cell (DAC) at room temperature. Rietveld refinement of the X-ray powder diffraction data reveals that the rhombohedral structure MoB 2 is stable up to 24.1 GPa. The ADXRD data yield a bulk modulus K 0  = 314(11) GPa with a pressure derivative K 0 ′  = 6.4(1.5). The experimental data are discussed and compared to the results of first-principles calculations. In addition, the compressibility of the unit cell axes (a and c axes) of MoB 2 demonstrates an anisotropic property with pressure increasing

In situ synchrotron X-ray diffraction study of hydrides in Zircaloy-4 during thermomechanical cycling

Energy Technology Data Exchange (ETDEWEB)

Cinbiz, Mahmut N., E-mail: cinbizmn@ornl.gov [Department of Mechanical and Nuclear Engineering, Pennsylvania State University, University Park, PA, 16802 (United States); Koss, Donald A., E-mail: koss@ems.psu.edu [Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA, 16802 (United States); Motta, Arthur T., E-mail: atm2@psu.edu [Department of Mechanical and Nuclear Engineering, Pennsylvania State University, University Park, PA, 16802 (United States); Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA, 16802 (United States); Park, Jun-Sang, E-mail: parkjs@aps.anl.gov [Advanced Photon Source, Argonne National Laboratory, Argonne, IL, 60439 (United States); Almer, Jonathan D., E-mail: almer@aps.anl.gov [Advanced Photon Source, Argonne National Laboratory, Argonne, IL, 60439 (United States)

2017-04-15

The d-spacing evolution of both in-plane and out-of-plane hydrides has been studied using in situ synchrotron radiation X-ray diffraction during thermo-mechanical cycling of cold-worked stress-relieved Zircaloy-4. The structure of the hydride precipitates is such that the δ{111} d-spacing of the planes aligned with the hydride platelet face is greater than the d-spacing of the 111 planes aligned with the platelet edges. Upon heating from room temperature, the δ{111} planes aligned with hydride plate edges exhibit bi-linear thermally-induced expansion. In contrast, the d-spacing of the (111) plane aligned with the hydride plate face initially contracts upon heating. These experimental results can be understood in terms of a reversal of stress state associated with precipitating or dissolving hydride platelets within the α-zirconium matrix. - Highlights: •The δ{111} d-spacings aligned with the hydride plate edges exhibit a bi-linear thermal expansion. •Stress state reversal is predicted with the onset of hydride dissolution. •During dissolution, the δ{111} planes oriented parallel to the hydride plate face initially contract upon heating. •Hydride d-spacings indicate that both in-plane (circumferential) and out-of-plane (radial) hydrides are in the same strain-state and likely in the same stress state as well.

Stress-dependent crystal structure of lanthanum strontium cobalt ferrite by in situ synchrotron X-ray diffraction

Science.gov (United States)

Geiger, Philipp T.; Khansur, Neamul H.; Riess, Kevin; Martin, Alexander; Hinterstein, Manuel; Webber, Kyle G.

2018-02-01

Lanthanum strontium cobalt ferrite La1-xSrxCo1-yFeyO3-δ (LSCF) is one of the most studied mixed ionic-electronic conductor materials due to electrical and transport properties, which are attractive for intermediate temperature solid oxide fuel cells (SOFCs), oxygen permeation membranes, and catalysis. The integration of such materials, however, depends on the thermal as well as mechanical behavior. LSCF exhibits nonlinear hysteresis during compressive stress-strain measurements, marked by a remanent strain and coercive stress, i.e., ferroelasticity. However, the origin of ferroelastic behavior has not been investigated under high compressive stress. This study, therefore, investigates the microscopic origin of stress-induced mechanical behavior in polycrystalline (La0.6Sr0.4)0.95Co0.2Fe0.8O3-δ using in situ synchrotron x-ray diffraction. The data presented here reveals that the strain response originates from the intrinsic lattice strain as well as the extrinsic domain switching strain without any apparent change in crystallographic symmetry. A comparison of the calculated microscopic strain contribution with that of a macroscopic measurement indicates a significant change in the relative contributions of intrinsic and extrinsic strain depending on the applied stress state, i.e., under maximum stress and after unloading. Direct evidence of the microscopic origin of stress-strain response outlined in this paper may assist in guiding materials design with the improved mechanical reliability of SOFCs.

Near edge x-ray spectroscopy theory

International Nuclear Information System (INIS)

1994-01-01

We propose to develop a quantitative theory of x-ray spectroscopies in the near edge region, within about 100 eV of threshold. These spectroscopies include XAFS (X-ray absorption fine structure), photoelectron diffraction (PD), and diffraction anomalous fine structure (DAFS), all of which are important tools for structural studies using synchrotron radiation x-ray sources. Of primary importance in these studies are many-body effects, such as the photoelectron self-energy, and inelastic losses. A better understanding of these quantities is needed to obtain theories without adjustable parameters. We propose both analytical and numerical calculations, the latter based on our x-ray spectroscopy codes FEFF

Synchrotron x-ray imaging of acoustic cavitation bubbles induced by acoustic excitation

International Nuclear Information System (INIS)

Jung, Sung Yong; Park, Han Wook; Park, Sung Ho; Lee, Sang Joon

2017-01-01

The cavitation induced by acoustic excitation has been widely applied in various biomedical applications because cavitation bubbles can enhance the exchanges of mass and energy. In order to minimize the hazardous effects of the induced cavitation, it is essential to understand the spatial distribution of cavitation bubbles. The spatial distribution of cavitation bubbles visualized by the synchrotron x-ray imaging technique is compared to that obtained with a conventional x-ray tube. Cavitation bubbles with high density in the region close to the tip of the probe are visualized using the synchrotron x-ray imaging technique, however, the spatial distribution of cavitation bubbles in the whole ultrasound field is not detected. In this study, the effects of the ultrasound power of acoustic excitation and working medium on the shape and density of the induced cavitation bubbles are examined. As a result, the synchrotron x-ray imaging technique is useful for visualizing spatial distributions of cavitation bubbles, and it could be used for optimizing the operation conditions of acoustic cavitation. (paper)

Polarisation resonance in X-ray diffraction

International Nuclear Information System (INIS)

Goodman, P.; Paterson, D.; Matheson, S.

1994-01-01

The study of crystal structures by means of dynamic X-ray diffraction has placed a challenge to theoreticians to revise the X-ray diffraction theory based on Maxwell's equation. In this paper the feasibility of using 'polarisation resonance' as a tool in the determination of absolute configuration for asymmetric structures is investigated. Two (left- and right-handed), σ + and σ- , circular polarization states for 3-beam conditions are considered. Moreover, extending interaction into the 3 rd. dimension (normal to the beam) opens the possibility of absolute configuration determination of asymmetric structures in 3 dimensions. The computational scheme used is shown in terms of scattering diagrams. 7 refs., 1 tab., 6 figs

Intergranular stress study of TC11 titanium alloy after laser shock peening by synchrotron-based high-energy X-ray diffraction

Science.gov (United States)

Su, R.; Li, L.; Wang, Y. D.; Nie, Z. H.; Ren, Y.; Zhou, X.; Wang, J.

2018-05-01

The distribution of residual lattice strain as a function of depth were carefully investigated by synchrotron-based high energy X-ray diffraction (HEXRD) in TC11 titanium alloy after laser shock peening (LSP). The results presented big compressive residual lattice strains at surface and subsurface, then tensile residual lattice strains in deeper region, and finally close to zero lattice strains in further deep interior with no plastic deformation thereafter. These evolutions in residual lattice strains were attributed to the balance of direct load effect from laser shock wave and the derivative restriction force effect from surrounding material. Significant intergranular stress was evidenced in the processed sample. The intergranular stress exhibited the largest value at surface, and rapidly decreased with depth increase. The magnitude of intergranular stress was proportional to the severity of the plastic deformation caused by LSP. Two shocks generated larger intergranular stress than one shock.

On the theory of time-resolved x-ray diffraction

DEFF Research Database (Denmark)

Henriksen, Niels Engholm; Møller, Klaus Braagaard

2008-01-01

We derive the basic theoretical formulation for X-ray diffraction with pulsed fields, using a fully quantized description of light and matter. Relevant time scales are discussed for coherent as well as incoherent X-ray pulses, and we provide expressions to be used for calculation...... of the experimental diffraction signal for both types of X-ray sources. We present a simple analysis of time-resolved X-ray scattering for direct bond breaking in diatomic molecules. This essentially analytical approach highlights the relation between the signal and the time-dependent quantum distribution...

Hard X-ray diffraction enhanced imaging only using two crystals

Institute of Scientific and Technical Information of China (English)

LI Gang; WANG Nan; WU Ziyu

2004-01-01

Different configurations for the monochromator crystals and the analyzer crystals have been used in hard X-ray diffraction enhanced imaging (DEI) methods to overcome the complex task to adjust each of them to the ideal position. Here we present a very compact DEI configuration, and preliminary results of experiments performed at the Beijing Synchrotron Radiation Facility (BSRF) using only two crystals: the first one acting as monochromator and the second one as analyzer in the Bragg geometry. Refraction contrast images characterized by high contrast and spatial resolution are obtained and compared with absorption images. Differences among these images will be outlined and discussed emphasizing the potential capabilities of this very simple layout that guarantees a high transmission efficiency.

Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom); Thomas, Pamela A. [Department of Physics, University of Warwick, Coventry, CV4 7AL (United Kingdom); Nisbet, Gareth; Collins, Stephen P. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom)

2015-05-14

The identification and high-resolution mapping of the absolute crystallographic structure in multi-domain ferroelectric KTiOPO{sub 4} is achieved through a novel synchrotron X-ray diffraction method. On a single Bragg reflection, the intensity ratio in resonant diffraction below and above the Ti absorption K edge demonstrates a domain contrast up to a factor of ∼270, thus implementing a non-contact, non-destructive imaging technique with micrometre spatial resolution, applicable to samples of arbitrarily large dimensions. A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO{sub 4}. Resonant (or ‘anomalous’) X-ray diffraction spectra collected across the absorption K edge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry, which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics)

Recent advances in continuum plasticity: phenomenological modeling and experimentation using X-ray diffraction

Science.gov (United States)

Edmiston, John Kearney

This work explores the field of continuum plasticity from two fronts. On the theory side, we establish a complete specification of a phenomenological theory of plasticity for single crystals. The model serves as an alternative to the popular crystal plasticity formulation. Such a model has been previously proposed in the literature; the new contribution made here is the constitutive framework and resulting simulations. We calibrate the model to available data and use a simple numerical method to explore resulting predictions in plane strain boundary value problems. Results show promise for further investigation of the plasticity model. Conveniently, this theory comes with a corresponding experimental tool in X-ray diffraction. Recent advances in hardware technology at synchrotron sources have led to an increased use of the technique for studies of plasticity in the bulk of materials. The method has been successful in qualitative observations of material behavior, but its use in quantitative studies seeking to extract material properties is open for investigation. Therefore in the second component of the thesis several contributions are made to synchrotron X-ray diffraction experiments, in terms of method development as well as the quantitative reporting of constitutive parameters. In the area of method development, analytical tools are developed to determine the available precision of this type of experiment—a crucial aspect to determine if the method is to be used for quantitative studies. We also extract kinematic information relating to intragranular inhomogeneity which is not accessible with traditional methods of data analysis. In the area of constitutive parameter identification, we use the method to extract parameters corresponding to the proposed formulation of plasticity for a titanium alloy (HCP) which is continuously sampled by X-ray diffraction during uniaxial extension. These results and the lessons learned from the efforts constitute early reporting

Study of the Elasto-plastic Properties of Mineralized Biomaterials via Synchrotron High-energy X-ray Diffraction

Science.gov (United States)

Deymier-Black, Alix Christine

Synchrotron high-energy X-ray diffraction was employed to investigate the strains in the hydroxyapatite (HAP) platelets and mineralized collagen fibrils in bovine dentin and cortical bone. The HAP and the fibrillar apparent moduli, defined as the applied stress divided by the phase strain, in dentin were measured as 27+/-7.2 and 16+/-4.9 GPa. The HAP apparent modulus ( EHAPapp ) is less than the lower bound calculated for EHAPapp from the Voigt model. This discrepancy is probably due to stress concentrators or decreases in the HAP Young's modulus due to size or composition effects. EHAPapp and Efibapp in dentin vary significantly within a single tooth in both the apical-cervical direction and the buccal-lingual direction. However, the variation between teeth is minimal. The HAP and fibrillar apparent moduli are not affected by freezing in dentin or by X-ray irradiation in bone and dentin. X-ray irradiation causes a decrease in HAP residual strain in bone. This decrease suggests the presence of HAP-collagen interfacial damage. It was determined from the HAP 00.2 peak broadening that irradiation damage mostly affects the HAP unit cells which are under the highest strain. From this it was theorized that irradiation may damage highly-strained bonds at stress concentrators and/or calcium-mediated electrostatic bonds. The fact that the apparent modulus does not change with irradiation suggests that the interfacial damage must be reversible. Bone and dentin both undergo creep when loaded to high stresses. At low irradiation doses, both the fibrillar and HAP strains increase with creep time indicating that load is being transferred from the matrix to the HAP. However, at high doses, the strain on the HAP decreases with creep time. This supports the interfacial damage theory which would allow the HAP to release its elastic load upon interfacial debonding. At -80 MPa, beyond a dose of 50 kGy, the rate of change in HAP strain with time begins to increase, becoming positive at

Room temperature femtosecond X-ray diffraction of photosystem II microcrystals

Science.gov (United States)

Kern, Jan; Alonso-Mori, Roberto; Hellmich, Julia; Tran, Rosalie; Hattne, Johan; Laksmono, Hartawan; Glöckner, Carina; Echols, Nathaniel; Sierra, Raymond G.; Sellberg, Jonas; Lassalle-Kaiser, Benedikt; Gildea, Richard J.; Glatzel, Pieter; Grosse-Kunstleve, Ralf W.; Latimer, Matthew J.; McQueen, Trevor A.; DiFiore, Dörte; Fry, Alan R.; Messerschmidt, Marc; Miahnahri, Alan; Schafer, Donald W.; Seibert, M. Marvin; Sokaras, Dimosthenis; Weng, Tsu-Chien; Zwart, Petrus H.; White, William E.; Adams, Paul D.; Bogan, Michael J.; Boutet, Sébastien; Williams, Garth J.; Messinger, Johannes; Sauter, Nicholas K.; Zouni, Athina; Bergmann, Uwe; Yano, Junko; Yachandra, Vittal K.

2012-01-01

Most of the dioxygen on earth is generated by the oxidation of water by photosystem II (PS II) using light from the sun. This light-driven, four-photon reaction is catalyzed by the Mn4CaO5 cluster located at the lumenal side of PS II. Various X-ray studies have been carried out at cryogenic temperatures to understand the intermediate steps involved in the water oxidation mechanism. However, the necessity for collecting data at room temperature, especially for studying the transient steps during the O–O bond formation, requires the development of new methodologies. In this paper we report room temperature X-ray diffraction data of PS II microcrystals obtained using ultrashort (< 50 fs) 9 keV X-ray pulses from a hard X-ray free electron laser, namely the Linac Coherent Light Source. The results presented here demonstrate that the ”probe before destroy” approach using an X-ray free electron laser works even for the highly-sensitive Mn4CaO5 cluster in PS II at room temperature. We show that these data are comparable to those obtained in synchrotron radiation studies as seen by the similarities in the overall structure of the helices, the protein subunits and the location of the various cofactors. This work is, therefore, an important step toward future studies for resolving the structure of the Mn4CaO5 cluster without any damage at room temperature, and of the reaction intermediates of PS II during O–O bond formation. PMID:22665786

Instability of cyclic superelastic deformation of NiTi investigated by synchrotron X-ray diffraction

Czech Academy of Sciences Publication Activity Database

Sedmák, P.; Šittner, Petr; Pilch, Jan; Curfs, C.

2015-01-01

Roč. 94, Aug (2015), s. 257-270 ISSN 1359-6454 R&D Projects: GA ČR GB14-36566G; GA ČR GPP108/12/P111; GA ČR GA14-15264S; GA ČR GAP107/12/0800 Institutional support: RVO:68378271 Keywords : shape memory alloy * NiTi * superelasticity * cyclic deformation * in situ X-ray diffraction Subject RIV: JG - Metallurgy Impact factor: 5.058, year: 2015

Ring artifact reduction in synchrotron X-ray tomography through helical acquisition

NARCIS (Netherlands)

D.M. Pelt (Daniël); D.Y. Parkinson (Dilworth)

2017-01-01

textabstractIn synchrotron X-ray tomography, systematic defects in certain detector elements can result in arc-shaped artifacts in the final reconstructed image of the scanned sample. These ring artifacts are commonly found in many applications of synchrotron tomography, and can make

Application of X-ray synchrotron microscopy instrumentation in biology

International Nuclear Information System (INIS)

Gasperini, F. M.; Pereira, G. R.; Granjeiro, J. M.; Calasans-Maia, M. D.; Rossi, A. M.; Perez, C. A.; Lopes, R. T.; Lima, I.

2011-01-01

X-ray micro-fluorescence imaging technique has been used as a significant tool in order to investigate minerals contents in some kinds of materials. The aim of this study was to evaluate the elemental distribution of calcium and zinc in bone substitute materials (nano-hydroxyapatite spheres) and cortical bones through X-Ray Micro-fluorescence analysis with the increment of Synchrotron Radiation in order to evaluate the characteristics of the newly formed bone and its interface, the preexisting bone and biomaterials by the arrangement of collagen fibers and its birefringence. The elemental mapping was carried out at Brazilian Synchrotron Light Laboratory, Campinas - Sao Paulo, Brazil working at D09-XRF beam line. Based on this study, the results suggest that hydroxyapatite-based biomaterials are biocompatible, promote osteo-conduction and favored bone repair. (authors)

Cloning, recombinant production, crystallization and preliminary X-ray diffraction analysis of SDF2-like protein from Arabidopsis thaliana

International Nuclear Information System (INIS)

Radzimanowski, Jens; Ravaud, Stephanie; Schott, Andrea; Strahl, Sabine; Sinning, Irmgard

2009-01-01

Overexpression, purification, crystallization and preliminary X-ray diffraction of the stromal-cell-derived factor 2-like protein of Arabidopsis thaliana are reported. The crystals belonged to the space group P6 1 and diffracted to 1.95 Å resolution. The stromal-cell-derived factor 2-like protein of Arabidopsis thaliana (AtSDL) has been shown to be highly up-regulated in response to unfolded protein response (UPR) inducing reagents, suggesting that it plays a crucial role in the plant UPR pathway. AtSDL has been cloned, overexpressed, purified and crystallized using the vapour-diffusion method. Two crystal forms have been obtained under very similar conditions. The needle-shaped crystals did not diffract X-rays, while the other form diffracted to 1.95 Å resolution using a synchrotron-radiation source and belonged to the hexagonal space group P6 1 , with unit-cell parameters a = b = 96.1, c = 69.3 Å

X-ray topography under conditions of monochromatic spherical wave diffraction

International Nuclear Information System (INIS)

Aristov, V.V.; Polovinkina, V.I.; Ibhikawa, Tetsuya; Kiduta, Seishi.

1981-01-01

An X-ray topographic scheme was developed in which there is a large distance between the X-ray source and the specimen. A monochromatic X-ray beam with an angular divergence 6 x 10 - 5 rad obtained by double successive diffraction in the (n 1 , +n 2 ) setting was used. This scheme enables diffraction focusing of a weakly absorbed wave field onto the exit surface of the crystal to be performed. Topographs of a wedge-shaped silicon crystal were obtained. Interference effects such as focusing, anomalous and ordinary Pendelloesung effects peculiar to X-ray spherical wave diffraction were observed in the topographs with high resolution. (author)

Synchrotron x-ray-diffraction study of the structure and growth of Xe films adsorbed on the Ag(111) surface

International Nuclear Information System (INIS)

Dai, P.; Wu, Z.; Angot, T.; Wang, S.; Taub, H.; Ehrlich, S.N.

1999-01-01

Synchrotron x-ray scattering has been used to investigate the structure and growth of perhaps the simplest of all films: xenon physisorbed on the Ag(111) surface. High-resolution x-ray scans of the in-plane structure and lower-resolution scans (specular and nonspecular) of the out-of-plane order were performed. The Xe films were prepared under both quasiequilibrium and kinetic growth conditions, and have fewer structural defects than those investigated previously by others on graphite substrates. Under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached at monolayer completion, and the monolayer and bilayer lattice constants at coexistence are inferred equal to within 0.005 Angstrom, consistent with theoretical calculations. The Xe/vacuum interface profile for a complete monolayer and bilayer grown at quasiequilibrium is found to be sharper than for kinetically grown films. At coverages above two layers, diffraction scans along the Xe(01l) rod for quasiequilibrated films are consistent with the presence of two domains having predominantly an ABC stacking sequence and rotated 60 degree with respect to each other about the surface normal. Annealing of these films alters neither the population of the two domains nor the fraction of ABA stacking faults. The thickest film grown under quasiequilibrium conditions exceeds 220 Angstrom (resolution limited). Under kinetic growth conditions, x-ray intensity oscillations at the Xe anti-Bragg position of the specular rod are observed as a function of time, indicating nearly layer-by-layer growth. Up to four complete oscillations corresponding to a film of eight layers have been observed before the intensity is damped out; the number of oscillations is found to depend on the substrate temperature, the growth rate, and the quality of the Ag(111) substrate. The specular reflectivity from kinetically grown films at nominal coverages of three and four layers has been analyzed using a Gaussian model which gives a film

Crystallographic parameters of magnetic Pr{sub 2}Fe{sub 14−x}Co{sub x}B-type alloys determined using anomalous x-ray diffraction with synchrotron radiation

Energy Technology Data Exchange (ETDEWEB)

Galego, E., E-mail: egalego@ipen.br; Serna, M.M.; Ramanathan, L.V.; Faria, R.N.

2017-02-15

Anomalous x-ray synchrotron diffraction was used to determine the crystallographic parameters of PrFeCoB-based magnetic alloys. The effect of cobalt concentration on the crystallographic parameters of the magnetically hard Pr{sub 2}Fe{sub 14−x}Co{sub x}B phase was studied. The results indicate that addition of cobalt has a marked effect on crystal structure. Variation of the c parameter decreased twice as much as the a parameter with increase in Co content. The positions of inequivalent atoms of the magnetically hard matrix phase ϕ in the Pr-based alloys were determined using Rietveld refinement. This permitted determination of the relative distance of each inequivalent atom from its nearest neighbors. Cobalt occupied the 16k{sub 2} site and Fe had a tendency to occupy the 8j{sub 2} sites located between the Kagomé layers. - Highlights: • Good magnetics properties can be achieved with addition of 4% and 8% Co. • Rietveld refinement is proposed for crystallographic parameters studies. • Co has preference to substitute Fe in 16k{sub 2} site and avoid the 8j{sub 2} site.

In situ synchrotron X-ray diffraction study of surface scale formation during CO2 corrosion of carbon steel at temperatures up to 90 oC

International Nuclear Information System (INIS)

Ingham, B.; Ko, M.; Kear, G.; Kappen, P.; Laycock, N.; Kimpton, J.A.; Williams, D.E.

2010-01-01

In situ synchrotron X-ray diffraction was used to follow the formation of corrosion product scales on carbon steel in CO 2 saturated brine at temperatures from 40 to 90 o C. The corrosion process was accelerated by applying a small anodic current, and in selected tests a scale inhibitor, amino trimethylene phosphonic acid (ATMPA), was added. Siderite was identified as the major phase in the scale formed in all conditions. With increasing temperature, the scale formation rate increased, while the scale thickness and crystallite size decreased. Above 60 o C, the scale became increasingly protective. The scale thickness and crystallite size decreased with increasing ATMPA concentration.

Structure of Se-Te glasses studied using neutron, X-ray diffraction and reverse Monte Carlo modelling

Energy Technology Data Exchange (ETDEWEB)

Itoh, Keiji, E-mail: itoh@okayama-u.ac.jp [Graduate School of Education, Okayama University, Tsushima-naka, Okayama 700-8530 (Japan); Research Reactor Institute, Kyoto University, Kumatori, Osaka 590-0494 (Japan)

2017-02-15

Pulsed neutron diffraction and synchrotron X-ray diffraction measurements were performed on Se{sub 100-x}Te{sub x} bulk glasses with x=10, 20, 30 and 40. The coordination numbers obtained from the diffraction results demonstrate that Se and Te atoms are twofold coordinated and the glass structure is formed by the chain network. The three-dimensional structure model for Se{sub 60}Te{sub 40} glass obtained by using reverse Monte Carlo modelling shows that the alternating arrangements of Se and Te atoms compose the major part of the chain clusters but several other fragments such as Se{sub n} chains and Te-Te dimers are also present in large numbers. The chain clusters have geometrically disordered forms and the interchain atomic order is different from those in the crystal structures of trigonal Se and trigonal Te. - Graphical abstract: Coordination environment in Se{sub 60}Te{sub 40} glass.

Diffractive sub-picosecond manipulation of x-rays

International Nuclear Information System (INIS)

Adams, B.

2004-01-01

A class of X-ray optical elements for the sub-picosecond manipulation of X-rays is proposed. The design of these elements is based upon a time-dependent dynamical diffraction theory that synthesizes the eikonal theory with the Takagi-Taupin theory. A brief outline of the theory is given

In-situ and operando characterization of batteries with energy-dispersive synchrotron x-ray diffraction

Science.gov (United States)

Paxton, William Arthur

Batteries play a pivotal role in the low-carbon society that is required to thwart the effects of climate change. Alternative low-carbon energy sources, such as wind and solar, are often intermittent and unreliable. Batteries are able capture their energy and deliver it later when it is needed. The implementation of battery systems in grid-level and transportation sectors is essential for efficient use of alternative energy sources. Scientists and engineers need better tools to analyze and measure the performance characteristics of batteries. One of the main hindrances in the progress of battery research is that the constituent electrode materials are inaccessible once an electrochemical cell is constructed. This leaves the researcher with a limited number of available feedback mechanisms to assess the cell's performance, e.g., current, voltage, and impedance. These data are limited in their ability to reveal the more-localized smaller-scale structural mechanisms on which the batteries' performance is so dependent. Energy-dispersive x-ray diffraction (EDXRD) is one of the few techniques that can internally probe a sealed battery. By analyzing the structural behavior of battery electrodes, one is able to gain insight to the physical properties on which the battery's performance is dependent. In this dissertation, EDXRD with ultrahigh energy synchrotron radiation is used to probe the electrodes of manufactured primary and secondary lithium batteries under in-situ and operando conditions. The technique is then applied to solve specific challenges facing lithium ion batteries. Diffraction spectra are collected from within a battery at 40 micrometer resolution. Peak-fitting is used to quantitatively estimate the abundance of lithiated and non-lithiated phases. Through mapping the distribution of phases within, structural changes are linked to the battery's galvanic response. A three-dimensional spatial analysis of lithium iron phosphate batteries suggests that evolution

Aqueous Nucleation and Growth of Titanium Oxides Using Time-Resolved Synchrotron X- ray Diffraction

Science.gov (United States)

Hummer, D. R.; Heaney, P. J.; Post, J. E.

2006-05-01

The inorganic precipitation of oxide minerals in soil environments has profound effects on a variety of geochemical processes. These include the removal of metals from the aqueous phase, the production of coatings that reduce the reactive surface area of pre-existing mineral grains, and the generation of feedstocks for microbial metabolic reactions. Recent observations of transient, metastable phases during the growth of oxide crystallites has raised questions about their role in crystallization mechanisms, and created a need for more detailed structural measurements. To better understand the process of nucleation and growth, we investigated the crystallization of Ti oxides from aqueous 0.5 M TiCl4 solutions using synchrotron X-ray diffraction at temperatures of 100 and 150 °C. Solutions were heated in a 1.0 mm internal diameter quartz glass capillary sealed with epoxy. Powder diffraction patterns of the growing crystallites were collected using image plate technology with a time step of ~ 4 minutes, providing high resolution in situ measurements of structural changes during the crystallization process. The data indicate a co-precipitation of the two crystalline phases anatase and rutile within the first 30 minutes of heating, followed by a gradual phase transition from anatase to rutile during particle coarsening throughout the 10 hour duration of an experiment. The co-existence of anatase and rutile at the onset of crystallization lends additional support to the assertion of nearly identical free energies for anatase and rutile at the nanoscale, believed to be due to the prominence of surface energy effects (Ranade et al., 2001). Whole pattern analyses using the Rietveld refinement method also documented previously unobserved changes in lattice parameters of both phases during growth, on the order of 0.2-0.3 % expansion for each axis. The trends in lattice parameters are observed to be temperature dependent, generally having lower values at higher

Structural investigation of semi-conductor nanostructures by x-ray diffraction

International Nuclear Information System (INIS)

Stangl, J.

2003-01-01

Full text: Semiconductor nanostructures present a topic of increasing interest due to their potential for new device concepts, as well as from a scientific point of view. In structures with dimensions smaller than the DeBroglie wavelength of electrons or holes, quantum confinement effects determine the electronic and optical properties. For the understanding of such structures, their structural investigation, i.e., the determination of size, shape, chemical composition and strain state is mandatory. X-ray diffraction is a powerful technique for this purpose. In particular, the strain fields within nanostructures as well as in the surrounding matrix can be determined with high precision. Using synchrotron radiation sources, also the distribution of chemical composition within objects with typically several nm height and 10 to 100 nm width can be established. With x-ray diffraction, the non-destructive investigation of uncapped and buried structures is possible. The latter is important, as for applications buried structures are needed, and during capping the structural properties may change considerably. Here, we will focus on so-called self-assembled nanostructures, which form during the deposition of different semiconductors on top of each other. In contrast to structures etched after growth of planar layers, self organized islands or wires are virtually defect-free and hence promising for applications. Different scattering techniques sensitive to shape and/or composition and strain will be discussed. (author)

Rapid small-angle X-ray diffraction of a tonically contracting molluscan smooth muscle recorded with imaging plates

International Nuclear Information System (INIS)

Tajima, Y.; Okada, K.; Yoshida, O.; Seto, T.; Amemiya, Y.

1989-01-01

Small-angle X-ray diffraction patterns from the anterior byssus retractor muscles of Mytilus edulis contracting tonically in response to stimulation with acetylcholine were recorded in a 30 s exposure with synchrotron radiation and a high-sensitivity X-ray area detector called an imaging plate. The 190 A layer line from the thin filaments increased in intensity with increase in tonic tension up to 6x10 4 kg m -2 . Above this value, the layer-line intensity remained almost constant and comparable to that for a contracting skeletal muscle, indicating that the same structural changes of the thin filaments occur in both muscles. (orig.)

Probing multi-scale mechanical damage in connective tissues using X-ray diffraction.

Science.gov (United States)

Bianchi, Fabio; Hofmann, Felix; Smith, Andrew J; Thompson, Mark S

2016-11-01

The accumulation of microstructural collagen damage following repetitive loading is linked to painful and debilitating tendon injuries. As a hierarchical, semi-crystalline material, collagen mechanics can be studied using X-ray diffraction. The aim of the study was to describe multi-structural changes in tendon collagen following controlled plastic damage (5% permanent strain). We used small angle X-ray scattering (SAXS) to interrogate the spacing of collagen molecules within a fibril, and wide angle X-ray scattering (WAXS) to measure molecular strains under macroscopic loading. Simultaneous recordings of SAXS and WAXS patterns, together with whole-tissue strain in physiologically hydrated rat-tail tendons were made during increments of in situ tensile loading. Results showed that while tissue level modulus was unchanged, fibril modulus decreased significantly, and molecular modulus significantly increased. Further, analysis of higher order SAXS peaks suggested structural changes in the gap and overlap regions, possibly localising the damage to molecular cross-links. Our results provide new insight into the fundamental damage processes at work in collagenous tissues and point to new directions for their mitigation and repair. This article reports the first in situ loading synchrotron studies on mechanical damage in collagenous tissues. We provide new insight into the nano- and micro-structural mechanisms of damage processes. Pre-damaged tendons showed differential alteration of moduli at macro, micro and nano-scales as measured using X-ray scattering techniques. Detailed analysis of higher order diffraction peaks suggested damage is localised to molecular cross-links. The results are consistent with previous X-ray scattering studies of tendons and also with recent thermal stability studies on damaged material. Detailed understanding of damage mechanisms is essential in the development of new therapies promoting tissue repair. Copyright © 2016 Acta Materialia Inc

Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC

International Nuclear Information System (INIS)

Dudley, Michael; Huang Xianrong; Vetter, William M

2003-01-01

A short review is presented of the various synchrotron white beam x-ray topography (SWBXT) imaging techniques developed for characterization of silicon carbide (SiC) crystals and thin films. These techniques, including back-reflection topography, reticulography, transmission topography, and a set of section topography techniques, are demonstrated to be particularly powerful for imaging hollow-core screw dislocations (micropipes) and closed-core threading screw dislocations, as well as other defects, in SiC. The geometrical diffraction mechanism commonly underlying these imaging processes is emphasized for understanding the nature and origins of these defects. Also introduced is the application of SWBXT combined with high-resolution x-ray diffraction techniques to complete characterization of 3C/4H or 3C/6H SiC heterostructures, including polytype identification, 3C variant mapping, and accurate lattice mismatch measurements

High pressure in-situ X-ray diffraction study on Zn-doped magnetite nanoparticles

Science.gov (United States)

Ferrari, S.; Bilovol, V.; Pampillo, L. G.; Grinblat, F.; Errandonea, D.

2018-03-01

We have performed high pressure synchrotron X-ray powder diffraction experiments on two different samples of Zn-doped magnetite nanoparticles (formula Fe(3-x)ZnxO4; x = 0.2, 0.5). The structural behavior of then a noparticles was studied up to 13.5 GPa for x = 0.2, and up to 17.4 GPa for x = 0.5. We have found that both systems remain in the cubic spinel structure as expected for this range of applied pressures. The analysis of the unit cell volume vs. pressure results in bulk modulus values lower than in both end-members, magnetite (Fe3O4) and zinc ferrite (ZnFe2O4), suggesting that chemical disorder may favor compressibility, which is expected to improve the increase of the Neel temperature under compression.

Grazing incidence synchrotron X-ray diffraction of marbles consolidated with diammonium hydrogen phosphate treatments: non-destructive probing of buried minerals

Science.gov (United States)

Possenti, Elena; Colombo, Chiara; Conti, Claudia; Gigli, Lara; Merlini, Marco; Plaisier, Jasper Rikkert; Realini, Marco; Gatta, G. Diego

2018-05-01

Diammonium hydrogen phosphate (DAP)-based consolidating treatments react with carbonatic stones and form calcium phosphates phases, whose composition depends on the availability of free calcium ions. In this work, an innovative non-destructive approach based on grazing incidence X-ray diffraction (GIXRD) with synchrotron radiation (SR) is used to investigate DAP-treated Carrara marble specimens and to study the influence of the substrate composition on the crystallization of calcium phosphate phases. The outcomes indicate that the presence of compositional micro-heterogeneity of Carrara marble favours the formation of specific phases. Dicalcium phosphate dihydrate, a calcium phosphate with a low Ca/P molar ratio, is formed on carbonatic phases with a low Ca amount, such as dolomite grains and Mg-containing veins. Furthermore, this study highlights the potentialities of SR-GIXRD as a powerful non-destructive tool for the diagnostic of Cultural Heritage objects since it allows investigating the conservation history of stone materials and their interaction with the environment.

Diffraction enhanced kinetic depth X-ray imaging

Science.gov (United States)

Dicken, A.

An increasing number of fields would benefit from a single analytical probe that can characterise bulk objects that vary in morphology and/or material composition. These fields include security screening, medicine and material science. In this study the X-ray region is shown to be an effective probe for the characterisation of materials. The most prominent analytical techniques that utilise X-radiation are reviewed. The study then focuses on methods of amalgamating the three dimensional power of kinetic depth X-ray (KDFX) imaging with the materials discrimination of angular dispersive X-ray diffraction (ADXRD), thus providing KDEX with a much needed material specific counterpart. A knowledge of the sample position is essential for the correct interpretation of diffraction signatures. Two different sensor geometries (i.e. circumferential and linear) that are able to collect end interpret multiple unknown material diffraction patterns and attribute them to their respective loci within an inspection volume are investigated. The circumferential and linear detector geometries are hypothesised, simulated and then tested in an experimental setting with the later demonstrating a greater ability at discerning between mixed diffraction patterns produced by differing materials. Factors known to confound the linear diffraction method such as sample thickness and radiation energy have been explored and quantified with a possible means of mitigation being identified (i.e. via increasing the sample to detector distance). A series of diffraction patterns (following the linear diffraction approach) were obtained from a single phantom object that was simultaneously interrogated via KDEX imaging. Areas containing diffraction signatures matched from a threat library have been highlighted in the KDEX imagery via colour encoding and match index is inferred by intensity. This union is the first example of its kind and is called diffraction enhanced KDEX imagery. Finally an additional

Study of the earth's deep interior and crystallography. X-ray and neutron diffraction experiments under high pressures

International Nuclear Information System (INIS)

Yagi, Takehiko

2014-01-01

History of the study of the Earth's deep interior was reviewed. In order to understand Earth's deep interior from the view point of materials science, X-ray diffraction under high pressure and high temperature played very important role. Use of synchrotron radiation dramatically advanced this experimental technique and it is now possible to make precise X-ray study under the P-T conditions corresponding even to the center of the Earth. In order to clarify the behavior of light elements such as hydrogen, however, studies using neutron diffraction are also required. A new neutron beam line dedicated for high-pressure science is constructed at J-PARC and is now ready for use. (author)

3-D growth of a short fatigue crack within a polycrystalline microstructure studied using combined diffraction and phase-contrast X-ray tomography

DEFF Research Database (Denmark)

Herbig, M.; King, Andrew; Reischig, Peter

2011-01-01

X-ray diffraction contrast tomography is a recently developed, non-destructive synchrotron imaging technique which characterizes microstructure and grain orientation in polycrystalline materials in three dimensions. By combining it with propagation-based phase-contrast tomography it is possible t...

Determination of electronic and atomic properties of surface, bulk and buried interfaces: Simultaneous combination of hard X-ray photoelectron spectroscopy and X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Rubio-Zuazo, J., E-mail: rubio@esrf.fr [SpLine, Spanish CRG BM25 Beamline at the ESRF, ESRF, B.P. 220, F-38043 Grenoble (France); Instituto de Ciencia de Materiales de Madrid, ICMM, CSIC, Cantoblanco, E-28049 Madrid (Spain); Castro, G.R. [SpLine, Spanish CRG BM25 Beamline at the ESRF, ESRF, B.P. 220, F-38043 Grenoble (France); Instituto de Ciencia de Materiales de Madrid, ICMM, CSIC, Cantoblanco, E-28049 Madrid (Spain)

2013-10-15

Highlights: •We have developed a novel and exceptional tool for non-destructive characterization of bulk and buried interfaces that combine XRD and HAXPES. •We studied the correlation between the atomic, electronic and transport properties of oxygen deficient manganite thin films. •The diffraction data showed a cooperative tilt of the MnO{sub 6} block along the out-of-plane direction. •We shown the absence of the conventional basal plane rotation for the oxygen deficient samples. -- Abstract: Hard X-ray photoelectron spectroscopy (HAXPES) is a powerful novel emerging technique for bulk compositional, chemical and electronic properties determination in a non-destructive way. It benefits from the exceptionally large escape depth of high kinetic energy photoelectrons enabling the study of bulk and buried interfaces up to several tens of nanometres depth. Its advantage over conventional XPS is based on the long mean free path of high kinetic energetic photoelectrons. Using the advantage of tuneable X-ray radiation provided by synchrotron sources the photoelectron kinetic energy, i.e. the information depth can be changed and consequently electronic and compositional depth profiles can be obtained. The combination of HAXPES with an atomic structure sensitive technique, as X-ray diffraction, opens a new research field with great potential for many systems in which their electronic properties are intimately linked to their crystallographic structure. At SpLine, the Spanish CRG Beamline at the European Synchrotron Radiation Facility (ESRF) we have developed a novel and exceptional set-up that combine grazing incidence X-ray diffraction (GIXRD) and HAXPES. Both techniques can be operated simultaneously on the same sample and using the same excitation source. The set-up includes a heavy 2S+3D diffractometer and UHV chamber equipped with an electrostatic analyzer. The UHV chamber has also MBE evaporation sources, an ion gun, a LEED optic, a sample heating and cooling

Synchrotron X-ray adaptative monochromator: study and realization of a prototype

International Nuclear Information System (INIS)

Dezoret, D.

1995-01-01

This work presents a study of a prototype of a synchrotron X-ray monochromator. The spectral qualities of this optic are sensitive to the heat loads which are particularly important on third synchrotron generation like ESRF. Indeed, powers generated by synchrotron beams can reach few kilowatts and power densities about a few tens watts per square millimeters. The mechanical deformations of the optical elements of the beamlines issue issue of the heat load can damage their spectral efficiencies. In order to compensate the deformations, wa have been studying the transposition of the adaptive astronomical optics technology to the x-ray field. First, we have considered the modifications of the spectral characteristics of a crystal induced by x-rays. We have established the specifications required to a technological realisation. Then, thermomechanical and technological studies have been required to transpose the astronomical technology to an x-ray technology. After these studies, we have begun the realisation of a prototype. This monochromator is composed by a crystal of silicon (111) bonded on a piezo-electric structure. The mechanical control is a loop system composed by a infrared light, a Shack-Hartmann CDD and wave front analyser. This system has to compensate the deformations of the crystal in the 5 kcV to 60 kcV energy range with a power density of 1 watt per square millimeters. (authors)

Workshop on the coupling of synchrotron radiation IR and X-rays with tip based scanning probe microscopies X-TIP

Energy Technology Data Exchange (ETDEWEB)

Comin, F.; Martinez-Criado, G.; Mundboth, K.; Susini, J. [European Synchrotron Radiation Facility (ESRF), 38 - Grenoble (France); Purans, J.; Sammelselg, V. [Tartu Univ. (Estonia); Chevrier, J.; Huant, S. [Universite Joseph-Fourier, Grenoble I, LEPES, 38 (France); Hamilton, B. [School of Electrical Engineering and Electronics, Manchester (United Kingdom); Saito, A. [Osaka Univ., RIKEN/SPring8 (Japan); Dhez, O. [OGG, INFM/CNR, 38 - Grenoble (France); Brocklesby, W.S. [Southampton Univ., Optoelectronics Research Centre (United Kingdom); Alvarez-Prado, L.M. [Ovieado, Dept. de Fisica (Spain); Kuzmin, A. [Institute of Solid State Physics - Riga (Latvia); Pailharey, D. [CRMC-N - CNRS, 13 - Marseille (France); Tonneau, D. [CRMCN - Faculte des sciences de Luminy, 13 - Marseille (France); Chretien, P. [Laboratoire de Genie Electrique de Paris, 75 - Paris (France); Cricenti, A. [ISM-CNR, Rome (Italy); DeWilde, Y. [ESPCI, 75 - Paris (France)

2005-07-01

The coupling of scanning probe microscopy (SPM) with synchrotron radiation is attracting increasing attention from nano-science community. By combining these 2 tools one can visualize, for example, the sample nano-structure prior to any X-ray characterization. Coupled with focusing devices or independently, SPM can provide spatial resolution below the optical limits. Furthermore, the possibility of employing SPM to manipulate nano-objects under X-ray beams is another exciting perspective. This document gathers the transparencies of 6 of the presentations made at the workshop: 1) the combination of atomic force microscopy and X-ray beam - experimental set-up and objectives; 2) the combination of scanning probe microscope and X-rays for detection of electrons; 3) towards soft X-ray scanning microscopy using tapered capillaries and laser-based high harmonic sources; 4) near-field magneto-optical microscopy; 5) near-field scanning optical microscopy - a brief overview -; and 6) from aperture-less near-field optical microscopy to infra-red near-field night vision. 4 posters entitled: 1) development of laboratory setup for X-ray/AFM experiments, 2) towards X-ray diffraction on single islands, 3) nano-XEOL using near-field detection, and 4) local collection with a STM tip of photoelectrons emitted by a surface irradiated by visible of UV laser beam, are included in the document.

Workshop on the coupling of synchrotron radiation IR and X-rays with tip based scanning probe microscopies X-TIP

International Nuclear Information System (INIS)

Comin, F.; Martinez-Criado, G.; Mundboth, K.; Susini, J.; Purans, J.; Sammelselg, V.; Chevrier, J.; Huant, S.; Hamilton, B.; Saito, A.; Dhez, O.; Brocklesby, W.S.; Alvarez-Prado, L.M.; Kuzmin, A.; Pailharey, D.; Tonneau, D.; Chretien, P.; Cricenti, A.; DeWilde, Y.

2005-01-01

The coupling of scanning probe microscopy (SPM) with synchrotron radiation is attracting increasing attention from nano-science community. By combining these 2 tools one can visualize, for example, the sample nano-structure prior to any X-ray characterization. Coupled with focusing devices or independently, SPM can provide spatial resolution below the optical limits. Furthermore, the possibility of employing SPM to manipulate nano-objects under X-ray beams is another exciting perspective. This document gathers the transparencies of 6 of the presentations made at the workshop: 1) the combination of atomic force microscopy and X-ray beam - experimental set-up and objectives; 2) the combination of scanning probe microscope and X-rays for detection of electrons; 3) towards soft X-ray scanning microscopy using tapered capillaries and laser-based high harmonic sources; 4) near-field magneto-optical microscopy; 5) near-field scanning optical microscopy - a brief overview -; and 6) from aperture-less near-field optical microscopy to infra-red near-field night vision. 4 posters entitled: 1) development of laboratory setup for X-ray/AFM experiments, 2) towards X-ray diffraction on single islands, 3) nano-XEOL using near-field detection, and 4) local collection with a STM tip of photoelectrons emitted by a surface irradiated by visible of UV laser beam, are included in the document

Simulations of X-ray synchrotron beams using the EGS4 code system in medical applications

International Nuclear Information System (INIS)

Orion, I.; Henn, A.; Sagi, I.; Dilmanian, F.A.; Pena, L.; Rosenfeld, A.B.

2001-01-01

X-ray synchrotron beams are commonly used in biological and medical research. The availability of intense, polarized low-energy photons from the synchrotron beams provides a high dose transfer to biological materials. The EGS4 code system, which includes the photoelectron angular distribution, electron motion inside a magnetic field, and the LSCAT package, found to be the appropriate Monte Carlo code for synchrotron-produced X-ray simulations. The LSCAT package was developed in 1995 for the EGS4 code to contain the routines to simulate the linear polarization, the bound Compton, and the incoherent scattering functions. Three medical applications were demonstrated using the EGS4 Monte Carlo code as a proficient simulation code system for the synchrotron low-energy X-ray source. (orig.)

X-ray microscopy using collimated and focussed synchrotron radiation

International Nuclear Information System (INIS)

Jones, K.W.; Kwiatek, W.M.; Gordon, B.M.

1987-01-01

X-ray microscopy is a field that has developed rapidly in recent years. Two different approaches have been used. Zone plates have been employed to produce focused beams with sizes as low as 0.07 μm for x-ray energies below 1 keV. Images of biological materials and elemental maps for major and minor low Z have been produced using above and below absorption edge differences. At higher energies collimators and focusing mirrors have been used to make small diameter beams for excitation of characteristic K- or L-x rays of all elements in the periodic table. The practicality of a single instrument combining all the features of these two approaches is unclear. The use of high-energy x rays for x-ray microscopy has intrinsic value for characterization of thick samples and determination of trace amounts of most elements. A summary of work done on the X-26 beam line at the National Synchrotron Light Source (NSLS) with collimated and focused x rays with energies above 4 keV is given here. 6 refs., 5 figs., 1 tab

Coherent X-ray diffraction studies of mesoscopic materials

International Nuclear Information System (INIS)

Shabalin, Anatoly

2015-12-01

This thesis is devoted to three separate projects, which can be considered as independent. First, the dynamical scattering effects in the Coherent X-ray Diffractive Imaging (CXDI) method are discussed. Based on the simulation results, a straightforward method for correction for the refraction and absorption artifacts in the Bragg CXDI reconstruction is suggested. The second part summarizes the results of an Coherent X-ray Diffractive Imaging experiment with a single colloidal crystal grain. A remarkable result is that positions of individual particles in the crystal lattice have been resolved in three dimensions. The third project is devoted to X-ray diffraction experimental studies of structural evolution of colloidal crystalline films upon incremental heating. Based on the results of the analysis a model of structural evolution of a colloidal crystal upon heating on nanoscopic and mesoscopic length scales is suggested.

Inhomogeneous thermal expansion of metallic glasses in atomic-scale studied by in-situ synchrotron X-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Taghvaei, Amir Hossein, E-mail: amirtaghvaei@gmail.com [Department of Materials Science and Engineering, Shiraz University of Technology, Shiraz (Iran, Islamic Republic of); Shakur Shahabi, Hamed [IFW Dresden, Institute for Complex Materials, Helmholtzstr. 20, 01069 Dresden (Germany); Bednarčik, Jozef [Photon Science DESY, Notkestraße 85, 22603 Hamburg (Germany); Eckert, Jürgen [IFW Dresden, Institute for Complex Materials, Helmholtzstr. 20, 01069 Dresden (Germany); TU Dresden, Institute of Materials Science, 01062 Dresden (Germany)

2015-01-28

Numerous investigations have demonstrated that the elastic strain in metallic glasses subjected to mechanical loading could be inhomogeneous in the atomic-scale and it increases with distance from an average atom and eventually reaches the macroscopic strain at larger inter-atomic distances. We have observed a similar behavior for the thermal strain imposed by heating of Co{sub 40}Fe{sub 22}Ta{sub 8}B{sub 30} glassy particles below the glass transition temperature by analysis of the scattering data obtained by in-situ high-energy synchrotron X-ray diffraction (XRD). The results imply that the volumetric thermal strains calculated from the shift in position of the principal diffraction maximum and reduced pair correlation function (PDF) peaks are in good agreement for the length scales beyond 0.6 nm, corresponding to the atoms located over the third near-neighbor shell. However, smaller and even negative volumetric thermal strains have been calculated based on the shifts in the positions of the second and first PDF peaks, respectively. The structural changes of Co{sub 40}Fe{sub 22}Ta{sub 8}B{sub 30} glassy particles are accompanied by decreasing the average coordination number of the first near-neighbor shell, which manifests the occurrence of local changes in the short-range order upon heating. It is believed that the detected length-scale dependence of the volumetric thermal strain is correlated with the local atomic rearrangements taking place in the topologically unstable regions of the glass governed by variations in the atomic-level stresses.

Overview and perspective of materials characterization by using synchrotron radiation

International Nuclear Information System (INIS)

Kamitsubo, Hiromichi

2009-01-01

A peculiarity of techniques and the methods of synchrotron radiation are explained. It consists of five sections such as introduction, synchrotron radiation, interaction between X-ray and materials, analytical methods of materials using synchrotron radiation and perspective and problems. The second section described the principles of synchrotron orbit radiation, synchrotron light source, the main formulae and schematic drawing of undulator, and the synchrotron radiation facilities in Japan. The third section explained behavior of X-ray in materials, absorption, reflection, refraction and scattering of X-ray. The fourth section stated many analytical methods of materials; the surface diffractometer, powder diffractometer, high-energy X-ray diffraction, core-electron absorption spectroscopy, micro-beam diffraction, X-ray fluorescence, X-ray absorption fine structure (XAFS), and photoemission spectroscopy (PES). A characteristic feature of synchrotron radiation contains the large wave length ranges from infrared to X-ray, high directivity and brightness, linear (circular) polarization, pulsed light, good control and stability. The brightness spectra of Spring-8 and SAGA-LS, concept of synchrotron light source, undulator and wiggler, nine synchrotron radiation facilities in Japan, mass absorption coefficients of Cu and Au, and analysis of materials using synchrotron radiation are illustrated. (S.Y.)

The possibility of using x-ray diffraction with hair to screen for pathologic conditions such as breast cancer

International Nuclear Information System (INIS)

James, Veronica; Cookson, David

2000-01-01

Mammalian hair exhibits a complex structure on length scales ranging from a few to hundreds of Angstroms. High-quality synchrotron x-ray images have yielded new insight about the structure and packing of the intermediate keratinous filaments that represent the bulk of a hair's volume. When comparing human hair diffraction patterns from healthy individuals and breast cancer patients significant differences have been seen, raising the possibility that fiber diffraction may be useful as a screening technique for certain pathologic conditions

Time-resolved soft x-ray absorption setup using multi-bunch operation modes at synchrotrons

International Nuclear Information System (INIS)

Stebel, L.; Sigalotti, P.; Ressel, B.; Cautero, G.; Malvestuto, M.; Capogrosso, V.; Bondino, F.; Magnano, E.; Parmigiani, F.

2011-01-01

Here, we report on a novel experimental apparatus for performing time-resolved soft x-ray absorption spectroscopy in the sub-ns time scale using non-hybrid multi-bunch mode synchrotron radiation. The present setup is based on a variable repetition rate Ti:sapphire laser (pump pulse) synchronized with the ∼500 MHz x-ray synchrotron radiation bunches and on a detection system that discriminates and singles out the significant x-ray photon pulses by means of a custom made photon counting unit. The whole setup has been validated by measuring the time evolution of the L 3 absorption edge during the melting and the solidification of a Ge single crystal irradiated by an intense ultrafast laser pulse. These results pave the way for performing synchrotron time-resolved experiments in the sub-ns time domain with variable repetition rate exploiting the full flux of the synchrotron radiation.

X-ray diffraction

International Nuclear Information System (INIS)

Vries, J.L. de.

1976-01-01

The seventh edition of Philips' Review of literature on X-ray diffraction begins with a list of conference proceedings on the subject, organised by the Philips' organisation at regular intervals in various European countries. This is followed by a list of bulletins. The bibliography is divided according to the equipment (cameras, diffractometers, monochromators) and its applications. The applications are subdivided into sections for high/low temperature and pressure, effects due to the equipment, small angle scattering and a part for stress, texture and phase analyses of metals and quantitative analysis of minerals

X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

Energy Technology Data Exchange (ETDEWEB)

Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.; Kohn, V. G.; Marchenkova, M. A.; Pisarevskiy, Yu. V.; Prosekov, P. A., E-mail: prosekov@crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

2016-05-15

A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.

Preparation of specimens for analysis by: X-ray diffraction and X-ray fluorescence analysis

International Nuclear Information System (INIS)

Banos L, L.

2004-01-01

Specimen preparation is one of the most important requirements in the analysis of samples by X-ray Diffraction and X-ray Fluorescence. This statement is especially true for samples containing different types of materials. There are many forms of specimen suitable for X-ray analysis and the type of the sample as received will generally determine the method of pretreatment. It is convenient to refer to the material received for analysis as the sample, and that, which is actually analyzed as the specimen. The powder Diffraction method assumes that the particles in the specimen are ideally random orientation and that there are enough crystallites in the specimen to achieve a representative intensity distribution for these crystallites. X ray Fluorescence is essentially a comparative method of analysis, it is vital that all standards and unknowns be presented to the spectrometer in a reproducible and identical manner. (Author) 3 refs., 6 figs

Synchrotron applications in wood preservation and deterioration

Science.gov (United States)

Barbara L. Illman

2003-01-01

Several non-intrusive synchrotron techniques are being used to detect and study wood decay. The techniques use high intensity synchrotron-generated X-rays to determine the atomic structure of materials with imaging, diffraction, and absorption. Some of the techniques are X-ray absorption near edge structure (XANES), X-ray fluorescence spectroscopy (XFS), X-ray...

Soft X-ray microscopy and lithography with synchrotron radiation

International Nuclear Information System (INIS)

Gudat, W.

1977-12-01

Considerable progress in the technique microscopy with soft X-ray radiation has been achieved in particular through the application of synchrotron radiation. Various methods which are currently being studied theoretically or already being used practically will be described briefly. Attention is focussed on the method of contact microscopy. Various biological specimens have been investigated by this method with a resolution as good as 100 A. X-ray lithography which in the technical procedure is very similar to contact microscopy gives promise for the fabrication of high quality submicron structures in electronic device production. Important factors limiting the resolution and determining the performance of contact microscopy and X-ray lithography will be discussed. (orig.) [de

Hydration process for calcium-aluminate cement within EVA emulsion by SPring-8 synchrotron radiation x-ray diffraction method

International Nuclear Information System (INIS)

Kotera, Masaru; Matsuda, Ikuyo; Miyashita, Keiko; Adachi, Nobuyuki; Tamura, Hisayuki

2005-01-01

Polymer-modified mortars which consist of a polymer emulsion and cement materials have been widely developed in the construction materials fields. Forming process of the polymer-modified cement membrane simultaneously involves evaporation of water within the polymer emulsion and hydration of cement. It is important for the polymer-modified cement paste that the hydrate crystal of cement is generating by the hydration during the setting process under existence of the polymer emulsion. In this study, hydration process for calcium-aluminate cement under existence of poly (ethylene-vinyl acetate) (EVA) emulsion (polymer-cement ratio=100%) was investigated by X-ray diffraction method using synchrotron radiation (SPring-8). The diffraction peaks of calcium aluminate (CA) disappeared after the hardening, on the other hand, the peaks of hydrate crystals of calcium-aluminate cement (C 2 AH 8 and C 3 AH 6 ) could be observed. This polymer-modified cement paste hydrated using the water within the polymer emulsion. The hydration of C 2 AH 8 from CA started at around 300 min, and then C 3 AH 6 hydrate crystal increased after 700 min at ambient temperature. This implies that the conversion from C 2 AH 8 to C 3 AH 6 occurred to be more stable phase. The setting temperature affected the reaction rate. In case of hydration at 35degC, the start time of the hydration for calcium-aluminate cement was quicker than that in the ambient temperature four or more times. (author)

Report of the second workshop on synchrotron radiation sources for x-ray lithography

International Nuclear Information System (INIS)

Barton, M.Q.; Craft, B.; Williams, G.P.

1986-01-01

The reported workshop is part of an effort to implement a US-based x-ray lithography program. Presentations include designs for three storage rings (one superconducting and two conventional) and an overview of a complete lithography program. The background of the effort described, the need for synchrotron radiation, and the international competition in the area are discussed briefly. The technical feasibility of x-ray lithography is discussed, and synchrotron performance specifications and construction options are given, as well as a near-term plan. It is recommended that a prototype synchrotron source be built as soon as possible, and that a research and development plan on critical technologies which could improve cost effectiveness of the synchrotron source be established. It is further recommended that a small number of second generation prototype synchrotrons be distributed to IC manufacturing centers to expedite commercialization

X-ray diffraction 2 - diffraction principles

International Nuclear Information System (INIS)

O'Connor, B.

1999-01-01

Full text: The computation of powder diffraction intensities is based on the principle that the powder pattern comprises the summation of the intensity contributions from each of the crystallites (or single crystals) in the material. Therefore, it is of value for powder diffractionists to appreciate the form of the expression for calculating single crystal diffraction pattern intensities. This knowledge is especially important for Rietveld analysis practitioners in terms of the (i) mathematics of the method and (ii) retrieving single crystal structure data from the literature. We consider the integrated intensity from a small single crystal being rotated at velocity ω through the Bragg angle θ for reflection (hkl).... I(hkl) = [l o /ω]. [e 4 /m 2 c 4 ]. [λ 3 δV F(hkl) 2 /υ 2 ].[(1+cos 2 2θ)/2sin2θ] where e, m and c are the usual fundamental constants; λ is the x-ray wavelength, δV is the crystallite volume; F(hkl) is the structure factor; υ is the unit cell volume; and (1+cos 2 θ)/2sin2θ] is the Lorentz-polarisation factor for an unpolarised incident beam. The expression does not include a contribution for extinction. The influence of factors λ, δV, F(hkl) and υ on the intensities should be appreciated by powder diffractionists, especially the structure factor, F(hkl), which is responsible for the fingerprint nature of diffraction patterns, such as the rise and fall of intensity from peak to peak. The structure factor expression represents the summation of the scattered waves from each of the j scattering centres (i e atoms) in the unit cell: F(hkl) Σ f j exp[2πi (h.x j +k.y i +l. z i )] T j . Symbol f is the scattering factor (representing the atom-type scattering efficiency); (x, y, z) are the fractional position coordinates of atom j within the unit cell; and T is the thermal vibration factor for the atom given by: T j = 8π 2 2 > sin 2 θ/λ 2 with 2 > being the mean-square vibration amplitude of the atom (assumed to be isotropic). The

Single photon energy dispersive x-ray diffraction

International Nuclear Information System (INIS)

Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S.; Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H.; Tang, Henry

2014-01-01

With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored

Single photon energy dispersive x-ray diffraction

Energy Technology Data Exchange (ETDEWEB)

Higginbotham, Andrew; Patel, Shamim; Ciricosta, Orlando; Suggit, Matthew J.; Wark, Justin S. [Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom); Hawreliak, James A.; Collins, Gilbert W.; Coppari, Federica; Eggert, Jon H. [Lawrence Livermore National Laboratory, Livermore, California 94551 (United States); Tang, Henry [Department of Earth and Planetary Science, University of California Berkeley, Berkeley, California 94720 (United States)

2014-03-15

With the pressure range accessible to laser driven compression experiments on solid material rising rapidly, new challenges in the diagnosis of samples in harsh laser environments are emerging. When driving to TPa pressures (conditions highly relevant to planetary interiors), traditional x-ray diffraction techniques are plagued by increased sources of background and noise, as well as a potential reduction in signal. In this paper we present a new diffraction diagnostic designed to record x-ray diffraction in low signal-to-noise environments. By utilising single photon counting techniques we demonstrate the ability to record diffraction patterns on nanosecond timescales, and subsequently separate, photon-by-photon, signal from background. In doing this, we mitigate many of the issues surrounding the use of high intensity lasers to drive samples to extremes of pressure, allowing for structural information to be obtained in a regime which is currently largely unexplored.

Three-dimensional visualization of a human chromosome using coherent x-ray diffraction

International Nuclear Information System (INIS)

Nishino, Yoshinori; Ishikawa, Tetsuya; Takahashi, Yukio; Imamoto, Naoko; Maeshima, Kazuhiro

2010-01-01

We succeeded in observing a human chromosome in two- and three-dimensions using x-ray diffraction microscopy. X-ray diffraction microscopy is a lens-less imaging technique utilizing coherent x-ray diffraction, and can overcome various limitations in conventional lens-based x-ray microscopy. Biological applications of the method have been limited to 2D observation, and 3D observation has been long waited. We found that the reconstructed chromosome images contain high-density axial structure, which has not been observed under unstained or unlabeled conditions. The result experimentally demonstrates the effectiveness of x-ray diffraction microscopy in observing internal structures of unstained biological samples with high image contrast. (author)

Purification, crystallization and preliminary X-ray diffraction studies of UDP-N-acetylglucosamine pyrophosphorylase from Candida albicans

Energy Technology Data Exchange (ETDEWEB)

Maruyama, Daisuke; Nishitani, Yuichi; Nonaka, Tsuyoshi; Kita, Akiko [Department of Chemistry, Graduate School of Science, Kyoto University, Sakyo-ku, Kyoto 606-8502 (Japan); Fukami, Takaaki A.; Mio, Toshiyuki; Yamada-Okabe, Hisafumi [Kamakura Research Laboratory, Chugai Pharmaceutical Co. Ltd, 200 Kajiwara, Kamakura, Kanagawa 247-8530 (Japan); Yamada-Okabe, Toshiko [Department of Hygiene, School of Medicine, Yokohama City University, 3-9 Fukuura, Kanazawa, Yokohama 236-0004 (Japan); Miki, Kunio, E-mail: miki@kuchem.kyoto-u.ac.jp [Department of Chemistry, Graduate School of Science, Kyoto University, Sakyo-ku, Kyoto 606-8502 (Japan); RIKEN SPring-8 Center at Harima Institute, Koto 1-1-1, Sayocho, Sayo-gun, Hyogo 679-5148 (Japan)

2006-12-01

UDP-N-acetylglucosamine pyrophosphorylase was purified and crystallized and X-ray diffraction data were collected to 2.3 Å resolution. UDP-N-acetylglucosamine pyrophosphorylase (UAP) is an essential enzyme in the synthesis of UDP-N-acetylglucosamine. UAP from Candida albicans was purified and crystallized by the sitting-drop vapour-diffusion method. The crystals of the substrate and product complexes both diffract X-rays to beyond 2.3 Å resolution using synchrotron radiation. The crystals of the substrate complex belong to the triclinic space group P1, with unit-cell parameters a = 47.77, b = 62.89, c = 90.60 Å, α = 90.01, β = 97.72, γ = 92.88°, whereas those of the product complex belong to the orthorhombic space group P2{sub 1}2{sub 1}2{sub 1}, with unit-cell parameters a = 61.95, b = 90.87, c = 94.88 Å.

In Situ X-ray Diffraction Studies of (De)lithiation Mechanism in Silicon Nanowire Anodes

KAUST Repository

Misra, Sumohan

2012-06-26

Figure Persented: Silicon is a promising anode material for Li-ion batteries due to its high theoretical specific capacity. From previous work, silicon nanowires (SiNWs) are known to undergo amorphorization during lithiation, and no crystalline Li-Si product has been observed. In this work, we use an X-ray transparent battery cell to perform in situ synchrotron X-ray diffraction on SiNWs in real time during electrochemical cycling. At deep lithiation voltages the known metastable Li 15Si 4 phase forms, and we show that avoiding the formation of this phase, by modifying the SiNW growth temperature, improves the cycling performance of SiNW anodes. Our results provide insight on the (de)lithiation mechanism and a correlation between phase evolution and electrochemical performance for SiNW anodes. © 2012 American Chemical Society.

Recent advances in synchrotron-based hard x-ray phase contrast imaging

International Nuclear Information System (INIS)

Liu, Y; Nelson, J; Andrews, J C; Pianetta, P; Holzner, C

2013-01-01

Ever since the first demonstration of phase contrast imaging (PCI) in the 1930s by Frits Zernike, people have realized the significant advantage of phase contrast over conventional absorption-based imaging in terms of sensitivity to ‘transparent’ features within specimens. Thus, x-ray phase contrast imaging (XPCI) holds great potential in studies of soft biological tissues, typically containing low Z elements such as C, H, O and N. Particularly when synchrotron hard x-rays are employed, the favourable brightness, energy tunability, monochromatic characteristics and penetration depth have dramatically enhanced the quality and variety of XPCI methods, which permit detection of the phase shift associated with 3D geometry of relatively large samples in a non-destructive manner. In this paper, we review recent advances in several synchrotron-based hard x-ray XPCI methods. Challenges and key factors in methodological development are discussed, and biological and medical applications are presented. (paper)

Recent advances in synchrotron-based hard x-ray phase contrast imaging

Science.gov (United States)

Liu, Y.; Nelson, J.; Holzner, C.; Andrews, J. C.; Pianetta, P.

2013-12-01

Ever since the first demonstration of phase contrast imaging (PCI) in the 1930s by Frits Zernike, people have realized the significant advantage of phase contrast over conventional absorption-based imaging in terms of sensitivity to ‘transparent’ features within specimens. Thus, x-ray phase contrast imaging (XPCI) holds great potential in studies of soft biological tissues, typically containing low Z elements such as C, H, O and N. Particularly when synchrotron hard x-rays are employed, the favourable brightness, energy tunability, monochromatic characteristics and penetration depth have dramatically enhanced the quality and variety of XPCI methods, which permit detection of the phase shift associated with 3D geometry of relatively large samples in a non-destructive manner. In this paper, we review recent advances in several synchrotron-based hard x-ray XPCI methods. Challenges and key factors in methodological development are discussed, and biological and medical applications are presented.

A feasibility study of dynamic stress analysis inside a running internal combustion engine using synchrotron X-ray beams.

Science.gov (United States)

Baimpas, Nikolaos; Drakopoulos, Michael; Connolley, Thomas; Song, Xu; Pandazaras, Costas; Korsunsky, Alexander M

2013-03-01

The present investigation establishes the feasibility of using synchrotron-generated X-ray beams for time-resolved in situ imaging and diffraction of the interior components of an internal combustion engine during its operation. The demonstration experiment was carried out on beamline I12 (JEEP) at Diamond Light Source, UK. The external hutch of the JEEP instrument is a large-scale engineering test bed for complex in situ processing and simulation experiments. The hutch incorporates a large capacity translation and rotation table and a selection of detectors for monochromatic and white-beam diffraction and imaging. These capabilities were used to record X-ray movies of a motorcycle internal combustion engine running at 1850 r.p.m. and to measure strain inside the connecting rod via stroboscopic X-ray diffraction measurement. The high penetrating ability and high flux of the X-ray beam at JEEP allowed the observation of inlet and outlet valve motion, as well as that of the piston, connecting rod and the timing chain within the engine. Finally, the dynamic internal strain within the moving connecting rod was evaluated with an accuracy of ~50 × 10(-6).

Intensity of diffracted X-rays from biomolecules with radiation damage caused by strong X-ray pulses

International Nuclear Information System (INIS)

Kai, Takeshi; Tokuhisa, Atsushi; Moribayashi, Kengo; Fukuda, Yuji; Kono, Hidetoshi; Go, Nobuhiro

2014-01-01

In order to realize the coherent X-ray diffractive imaging of single biomolecules, the diffraction intensities, per effective pixel of a single biomolecule with radiation damage, caused by irradiation using a strong coherent X-ray pulse, were examined. A parameter survey was carried out for various experimental conditions, using a developed simulation program that considers the effect of electric field ionization, which was slightly reported on in previous studies. The two simple relationships among the parameters were identified as follows: (1) the diffraction intensity of a biomolecule slightly increases with the incident X-ray energy; and that (2) the diffraction intensity is approximately proportional to the target radius, when the radius is longer than 400 Å, since the upper limit of the incident intensity for damage to the biomolecules marginally changes with respect to the target radius. (author)

Synchrotron X-ray scattering study on stratum corneum of skin. Toward applied research based upon basic research

International Nuclear Information System (INIS)

Hatta, Ichiro; Ohta, Noboru; Yagi, Naoto

2008-01-01

On considering the applied research on stratum corneum of skin, it is indispensable to know the structure at the molecular level. However, there is even now in a controversy among the researchers who are performing its X-ray scattering study. Here we introduce our solution for the two problems: One is the correlation between the lamellar structures and hydrocarbon-chain packings in intercellular lipid matrix and the other is the existence of water layers in the short lamellar structure. These studies have become possible for the first time by making good use of synchrotron small-angle/wide-angle X-ray diffraction. Based upon the structural evidence, we can further carry out the applied research in stratum corneum. (author)

High resolution hard x-ray microscope on a second generation synchrotron source

International Nuclear Information System (INIS)

Tian Yangchao; Li Wenjie; Chen Jie; Liu Longhua; Liu Gang; Tian Jinping; Xiong Ying; Tkachuk, Andrei; Gelb, Jeff; Hsu, George; Yun Wenbing

2008-01-01

A full-field, transmission x-ray microscope (TXM) operating in the energy range of 7-11 keV has been installed at the U7A beamline at the National Synchrotron Radiation Laboratory, a second generation synchrotron source operating at 0.8 GeV. Although the photon flux at sample position in the operating energy range is significantly low due to its relatively large emittance, the TXM can get high quality x-ray images with a spatial resolution down to 50 nm with acceptable exposure time. This TXM operates in either absorption or Zernike phase contrast mode with similar resolution. This TXM is a powerful analytical tool for a wide range of scientific areas, especially studies on nanoscale phenomena and structural imaging in biology, materials science, and environmental science. We present here the property of the x-ray source, beamline design, and the operation and key optical components of the x-ray TXM. Plans to improve the throughput of the TXM will be discussed.

Single shot diffraction of picosecond 8.7-keV x-ray pulses

Directory of Open Access Journals (Sweden)

F. H. O’Shea

2012-02-01

Full Text Available We demonstrate multiphoton, single shot diffraction images of x rays produced by inverse Compton scattering a high-power CO_{2} laser from a relativistic electron beam, creating a pulse of 8.7 keV x rays. The tightly focused, relatively high peak brightness electron beam and high photon density from the 2 J CO_{2} laser yielded 6×10^{7} x-ray photons over the full opening angle in a single shot. Single shot x-ray diffraction is performed by passing the x rays though a vertical slit and on to a flat silicon (111 crystal. 10^{2} diffracted photons were detected. The spectrum of the detected x rays is compared to simulation. The diffraction and detection of 10^{2} x rays is a key step to a more efficient time resolved diagnostic in which the number of observed x rays might reach 10^{4}; enabling a unique, flexible x-ray source as a sub-ps resolution diagnostic for studying the evolution of chemical reactions, lattice deformation and melting, and magnetism.

A high resolution position sensitive X-ray MWPC for small angle X-ray diffraction

International Nuclear Information System (INIS)

Bateman, J.E.; Connolly, J.F.; Stephenson, R.; Tappern, G.J.

1981-02-01

A small sealed-off delay line readout MWPC X-ray detector has been designed and built for small angle X-ray diffraction applications. Featuring a sensitive area of 100 mm x 25 mm it yields a spatial resolution of 0.13 mm (standard deviation) with a high rate capability and good quantum efficiency for copper K radiation. (author)

Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals

Energy Technology Data Exchange (ETDEWEB)

Takahashi, Yumiko; Iida, Atuso E-mail: atsuo.iida@kek.jp; Takanishi, Yoichi; Ogasawara, Toyokazu; Takezoe, Hideo

2001-07-21

The time-resolved synchrotron X-ray microbeam diffraction experiment has been carried out to reveal the local layer response to the electric field in the antiferroelectric liquid crystal. The X-ray microbeam of a few {mu}m spatial resolution was obtained with Kirkpatrick-Baez optics. The time-resolved small angle diffraction experiment was performed with a time resolution ranging from 10 {mu}s to a few ms. The reversible local layer change between the horizontal chevron and the quasi-bookshelf structure was confirmed by the triangular wave form. The transient layer response for the step form electric field was observed. The layer response closely related with an electric field induced antiferroelectric to ferroelectric phase transition.

Time resolved X-ray micro-diffraction measurements of the dynamic local layer response to electric field in antiferroelectric liquid crystals

International Nuclear Information System (INIS)

Takahashi, Yumiko; Iida, Atuso; Takanishi, Yoichi; Ogasawara, Toyokazu; Takezoe, Hideo

2001-01-01

The time-resolved synchrotron X-ray microbeam diffraction experiment has been carried out to reveal the local layer response to the electric field in the antiferroelectric liquid crystal. The X-ray microbeam of a few μm spatial resolution was obtained with Kirkpatrick-Baez optics. The time-resolved small angle diffraction experiment was performed with a time resolution ranging from 10 μs to a few ms. The reversible local layer change between the horizontal chevron and the quasi-bookshelf structure was confirmed by the triangular wave form. The transient layer response for the step form electric field was observed. The layer response closely related with an electric field induced antiferroelectric to ferroelectric phase transition

Applications of a pnCCD detector coupled to columnar structure CsI(Tl) scintillator system in ultra high energy X-ray Laue diffraction

Science.gov (United States)

Shokr, M.; Schlosser, D.; Abboud, A.; Algashi, A.; Tosson, A.; Conka, T.; Hartmann, R.; Klaus, M.; Genzel, C.; Strüder, L.; Pietsch, U.

2017-12-01

Most charge coupled devices (CCDs) are made of silicon (Si) with typical active layer thicknesses of several microns. In case of a pnCCD detector the sensitive Si thickness is 450 μm. However, for silicon based detectors the quantum efficiency for hard X-rays drops significantly for photon energies above 10 keV . This drawback can be overcome by combining a pixelated silicon-based detector system with a columnar scintillator. Here we report on the characterization of a low noise, fully depleted 128×128 pixels pnCCD detector with 75×75 μm2 pixel size coupled to a 700 μm thick columnar CsI(Tl) scintillator in the photon range between 1 keV to 130 keV . The excellent performance of the detection system in the hard X-ray range is demonstrated in a Laue type X-ray diffraction experiment performed at EDDI beamline of the BESSY II synchrotron taken at a set of several GaAs single crystals irradiated by white synchrotron radiation. With the columnar structure of the scintillator, the position resolution of the whole system reaches a value of less than one pixel. Using the presented detector system and considering the functional relation between indirect and direct photon events Laue diffraction peaks with X-ray energies up to 120 keV were efficiently detected. As one of possible applications of the combined CsI-pnCCD system we demonstrate that the accuracy of X-ray structure factors extracted from Laue diffraction peaks can be significantly improved in hard X-ray range using the combined CsI(Tl)-pnCCD system compared to a bare pnCCD.

Theory of time-resolved inelastic x-ray diffraction

DEFF Research Database (Denmark)

Lorenz, Ulf; Møller, Klaus Braagaard; Henriksen, Niels Engholm

2010-01-01

Starting from a general theory of time-resolved x-ray scattering, we derive a convenient expression for the diffraction signal based on a careful analysis of the relevant inelastic scattering processes. We demonstrate that the resulting inelastic limit applies to a wider variety of experimental...... conditions than similar, previously derived formulas, and it directly allows the application of selection rules when interpreting diffraction signals. Furthermore, we present a simple extension to systems simultaneously illuminated by x rays and a laser beam....

X-ray studies on electrochemical systems. Synchrotron methods for energy materials

Energy Technology Data Exchange (ETDEWEB)

Braun, Artur [Empa. Eidgenoessische Materialpruefungs- und Forschungsanstalt, Duebendorf (Switzerland)

2017-07-01

This book is your graduate level entrance into battery, fuel cell and solar cell research at synchrotron X-ray sources. Materials scientists find numerous examples for the combination of electrochemical experiments with simple and with highly complex X-ray scattering and spectroscopy methods. Physicists and chemists can link applied electrochemistry with fundamental concepts of condensed matter physics, physical chemistry and surface science.

Data and videos for ultrafast synchrotron X-ray imaging studies of metal solidification under ultrasound

Directory of Open Access Journals (Sweden)

Bing Wang

2018-04-01

Full Text Available The data presented in this article are related to the paper entitled ‘Ultrafast synchrotron X-ray imaging studies of microstructure fragmentation in solidification under ultrasound’ [Wang et al., Acta Mater. 144 (2018 505-515]. This data article provides further supporting information and analytical methods, including the data from both experimental and numerical simulation, as well as the Matlab code for processing the X-ray images. Six videos constructed from the processed synchrotron X-ray images are also provided.

Synchrotron x-ray sources and new opportunities in the soil and environmental sciences

International Nuclear Information System (INIS)

Schulze, D.; Anderson, S.; Mattigod, S.

1990-07-01

This report contains the following papers: characteristics of the advanced photon source and comparison with existing synchrotron facilities; x-ray absorption spectroscopy: EXAFS and XANES -- A versatile tool to study the atomic and electronic structure of materials; applications of x-ray spectroscopy and anomalous scattering experiments in the soil and environmental sciences; X-ray fluorescence microprobe and microtomography

Spectroscopic imaging, diffraction, and holography with x-ray photoemission

Energy Technology Data Exchange (ETDEWEB)

1992-02-01

X-ray probes are capable of determining the spatial structure of an atom in a specific chemical state, over length scales from about a micron all the way down to atomic resolution. Examples of these probes include photoemission microscopy, energy-dependent photoemission diffraction, photoelectron holography, and X-ray absorption microspectroscopy. Although the method of image formation, chemical-state sensitivity, and length scales can be very different, these X-ray techniques share a common goal of combining a capability for structure determination with chemical-state specificity. This workshop will address recent advances in holographic, diffraction, and direct imaging techniques using X-ray photoemission on both theoretical and experimental fronts. A particular emphasis will be on novel structure determinations with atomic resolution using photoelectrons.

Spectroscopic imaging, diffraction, and holography with x-ray photoemission

International Nuclear Information System (INIS)

1992-02-01

X-ray probes are capable of determining the spatial structure of an atom in a specific chemical state, over length scales from about a micron all the way down to atomic resolution. Examples of these probes include photoemission microscopy, energy-dependent photoemission diffraction, photoelectron holography, and X-ray absorption microspectroscopy. Although the method of image formation, chemical-state sensitivity, and length scales can be very different, these X-ray techniques share a common goal of combining a capability for structure determination with chemical-state specificity. This workshop will address recent advances in holographic, diffraction, and direct imaging techniques using X-ray photoemission on both theoretical and experimental fronts. A particular emphasis will be on novel structure determinations with atomic resolution using photoelectrons

X-ray diffraction study of surface-layer structure in parallel grazing rays

International Nuclear Information System (INIS)

Shtypulyak, N.I.; Yakimov, I.I.; Litvintsev, V.V.

1989-01-01

An x-ray diffraction method is described for study of thin polycrystalline and amorphous films and surface layers in an extremely asymmetrical diffraction system in parallel grazing rays using a DRON-3.0 diffractometer. The minimum grazing angles correspond to diffraction under conditions of total external reflection and a layer depth of ∼ 2.5-8 nm

In situ synchrotron X-ray diffraction of ferroelastic La0.8Ca0.2CoO3 ceramics during uniaxial compression

International Nuclear Information System (INIS)

Vullum, Per Erik; Mastin, Johann; Wright, Jonathan; Einarsrud, Mari-Ann; Holmestad, Randi; Grande, Tor

2006-01-01

Uniaxial compression of rhombohedral La 0.8 Ca 0.2 CoO 3 ceramics has been studied in situ using synchrotron X-ray diffraction. The intensities of Bragg reflections parallel and perpendicular to the stress field were simultaneously detected as a function of the stress. Reorientation of ferroelastic domains due to the uniaxial stress was demonstrated. With increasing stress the volume fraction of domains with the hexagonal c-axis parallel to the stress axis increased at the expense of domains with the c-axis perpendicular to the stress axis. The strain in the polycrystalline materials evolved unevenly with increasing stress due to crystallographic anisotropy. In energetically favourable domains with the c-axis parallel to the stress axis, the rhombohedral distortion from cubic symmetry increased, while the crystal structure became closer to cubic in domains with the c-axis perpendicular to the stress. Successive compression/decompression cycles to higher maximum stress resulted in a higher volume fraction of reoriented domains both at maximum stress and after decompression

Combined Synchrotron X-ray Diffraction and Digital Image Correlation Technique for Measurement of Austenite Transformation with Strain in TRIP-assisted Steels

Energy Technology Data Exchange (ETDEWEB)

Poling, Whitney A.; Savic, Vesna; Hector, Louis G.; Sachdev, Anil K.; Hu, Xiaohua; Devaraj, Arun; Abu-Farha, Fadi

2016-04-05

The strain-induced, diffusionless shear transformation of retained austenite to martensite during straining of transformation induced plasticity (TRIP) assisted steels increases strain hardening and delays necking and fracture leading to exceptional ductility and strength, which are attractive for automotive applications. A novel technique that provides the retained austenite volume fraction variation with strain in TRIP-assisted steels with improved precision is presented. Digital images of the gauge section of tensile specimens were first recorded up to selected plastic strains with a stereo digital image correlation (DIC) system. The austenite volume fraction was measured by synchrotron X-ray diffraction from small squares cut from the gage section. Strain fields in the squares were then computed by localizing the strain measurement to the corresponding region of a given square during DIC post-processing of the images recorded during tensile testing. Results obtained for a QP980 steel are used to study the influence of initial volume fraction of austenite and the austenite transformation with strain on tensile mechanical behavior.

High-resolution X-ray diffraction studies of multilayers

DEFF Research Database (Denmark)

Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.

1988-01-01

High-resolution X-ray diffraction studies of the perfection of state-of-the-art multilayers are presented. Data were obtained using a triple-axis perfect-crystal X-ray diffractometer. Measurements reveal large-scale figure errors in the substrate. A high-resolution triple-axis set up is required...

Clinical step onward with X-ray dark-field imaging and perspective view of medical applications of synchrotron radiation in Japan

International Nuclear Information System (INIS)

Ando, M.; Hashimoto, E.; Hashizume, H.; Hyodo, K.; Inoue, H.; Kunisada, T.; Maksimenko, A.; Mori, K.; Rubenstein, E.; Roberson, J.; Shimao, D.; Sugiyama, H.; Takeda, K.; Toyofuku, F.; Ueno, E.; Umetani, K.; Wada, H.; Pattanasiriwisawa, W.

2005-01-01

This paper reports, the application of synchrotron radiation to basic medicine at SPring-8 involving instrumentation and medical application of imaging and scattering. Emphasis should be laid on X-ray dark-field imaging (DFI) whose goal is clinical diagnosis of organs that have been invisible by ordinary techniques. Development of this technique is under way both at SPring-8 and KEK. The X-ray optics of DFI comprises a Bragg asymmetric monochro-collimator and a Laue case analyzer with a diffraction index of 440 using the X-ray energy of 35keV (λ=0.0354nm) in a parallel position. This analyzer that can provide with 80mmx80mm view size has 2.15mm thickness. At present the spatial resolution is around 5-10μm. Visibility of some organs such as soft bone tissue at excised human femoral head and breast cancer tissue is under test. This preliminary test shows that the DFI seems feasible in clinical diagnosis. Furthermore, a perspective view of application of synchrotron radiation to clinical medicine in Japan will be given

Measurements of transient electron density distributions by femtosecond X-ray diffraction

International Nuclear Information System (INIS)

Freyer, Benjamin

2013-01-01

This thesis concerns measurements of transient charge density maps by femtosecond X-ray diffraction. Different X-ray diffraction methods will be considered, particularly with regard to their application in femtosecond X-ray diffraction. The rotation method is commonly used in stationary X-ray diffraction. In the work in hand an X-ray diffraction experiment is demonstrated, which combines the method with ultrafast X-ray pulses. This experiment is the first implementation which makes use of the rotation method to map transient intensities of a multitude of Bragg reflections. As a prototype material Bismuth is used, which previously was studied frequently by femtosecond X-ray diffraction by measuring Bragg reflections successively. The experimental results of the present work are compared with the literature data. In the second part a powder-diffraction experiment will be presented, which is used to study the dynamics of the electron-density distribution on ultrafast time scales. The experiment investigates a transition metal complex after photoexcitation of the metal to ligand charge transfer state. Besides expected results, i. e. the change of the bond length between the metal and the ligand and the transfer of electronic charge from the metal to the ligand, a strong contribution of the anion to the charge transfer was found. Furthermore, the charge transfer has predominantly a cooperative character. That is, the excitation of a single complex causes an alteration of the charge density of several neighboring units. The results show that more than 30 transition-metal complexes and 60 anions contribute to the charge transfer. This collective response is a consequence of the strong coulomb interactions of the densely packed ions.

Characterization of nanowires by coherent X-ray diffractive imaging and ptychography

Energy Technology Data Exchange (ETDEWEB)

Dzhigaev, Dmitry

2017-03-15

Imaging techniques are of paramount importance for our understanding of the universe. From galaxies and stars explored by huge telescopes down to micro and nanostructures studied by microscopes, imaging systems provide invaluable scientific information. When an object under investigation has a size of about 100 nanometers, X-rays become a perfect probe for non-destructive imaging. The manufacturing process of image forming lenses for X-rays becomes much more complicated comparing to optical ones. Therefore, ''lensless'' techniques which rely on the coherent properties of radiation were developed. With third generation of synchrotron sources highly coherent and intense X-ray beams became widely accessible. They are used in new imaging methods such as coherent X-ray diffractive imaging (CXDI) and X-ray ptychography. Modern nanotechnology opens a wide spectrum of possible applications in different branches of physics, chemistry, biology and engineering. At the nanoscale, matter has different physical and chemical properties compared to the macroscale bulk material. The continuing trend of miniaturization of functional components in semiconductor industry brings new challenges both in growth and characterization methods. This Thesis is focused on application of coherent diffractive imaging methods to reveal the structure of single semiconductor nanowires (NWs). They have been attracting significant attention for a couple of decades due to their efficient strain relaxation properties. And since the strain plays a significant role in NW performance the projects carried out in this work are oriented on Bragg CXDI approaches. Three distinct projects were carried out during my research activity at DESY research center of the Helmholtz Association. Experimental work was performed at P06 and P10 beamlines at PETRA III synchrotron. The first part of this Thesis extends the application of the three-dimensional (3D) Bragg CXDI to strain field mapping in a