WorldWideScience

Sample records for surface profile metrology

  1. Improving the surface metrology accuracy of optical profilers by using multiple measurements

    Xu, Xudong; Huang, Qiushi; Shen, Zhengxiang; Wang, Zhanshan

    2016-10-01

    The performance of high-resolution optical systems is affected by small angle scattering at the mid-spatial-frequency irregularities of the optical surface. Characterizing these irregularities is, therefore, important. However, surface measurements obtained with optical profilers are influenced by additive white noise, as indicated by the heavy-tail effect observable on their power spectral density (PSD). A multiple-measurement method is used to reduce the effects of white noise by averaging individual measurements. The intensity of white noise is determined using a model based on the theoretical PSD of fractal surface measurements with additive white noise. The intensity of white noise decreases as the number of times of multiple measurements increases. Using multiple measurements also increases the highest observed spatial frequency; this increase is derived and calculated. Additionally, the accuracy obtained using multiple measurements is carefully studied, with the analysis of both the residual reference error after calibration, and the random errors appearing in the range of measured spatial frequencies. The resulting insights on the effects of white noise in optical profiler measurements and the methods to mitigate them may prove invaluable to improve the quality of surface metrology with optical profilers.

  2. Development of Pseudorandom Binary Arrays for Calibration of Surface Profile Metrology Tools

    Barber, S.K.; Takacs, P.; Soldate, P.; Anderson, E.H.; Cambie, R.; McKinney, W.R.; Voronov, D.L.; Yashchuk, V.V.

    2009-01-01

    Optical metrology tools, especially for short wavelengths (extreme ultraviolet and x-ray), must cover a wide range of spatial frequencies from the very low, which affects figure, to the important mid-spatial frequencies and the high spatial frequency range, which produces undesirable scattering. A major difficulty in using surface profilometers arises due to the unknown point-spread function (PSF) of the instruments [G. D. Boreman, Modulation Transfer Function in Optical and Electro-Optical Systems (SPIE, Bellingham, WA, 2001)] that is responsible for distortion of the measured surface profile. Generally, the distortion due to the PSF is difficult to account for because the PSF is a complex function that comes to the measurement via the convolution operation, while the measured profile is described with a real function. Accounting for instrumental PSF becomes significantly simpler if the result of measurement of a profile is presented in the spatial frequency domain as a power spectral density (PSD) distribution [J. W. Goodman, Introduction to Fourier Optics, 3rd ed. (Roberts and Company, Englewood, CO, 2005)]. For example, measured PSD distributions provide a closed set of data necessary for three-dimensional calculations of scattering of light by the optical surfaces [E. L. Church et al., Opt. Eng. (Bellingham) 18, 125 (1979); J. C. Stover, Optical Scattering, 2nd ed. (SPIE Optical Engineering Press, Bellingham, WA, 1995)]. The distortion of the surface PSD distribution due to the PSF can be modeled with the modulation transfer function (MTF), which is defined over the spatial frequency bandwidth of the instrument. The measured PSD distribution can be presented as a product of the squared MTF and the ideal PSD distribution inherent for the system under test. Therefore, the instrumental MTF can be evaluated by comparing a measured PSD distribution of a known test surface with the corresponding ideal numerically simulated PSD. The square root of the ratio of the

  3. Metrology and properties of engineering surfaces

    Greenwood, J; Chetwynd, D

    2001-01-01

    Metrology and Properties of Engineering Surfaces provides in a single volume a comprehensive and authoritative treatment of the crucial topics involved in the metrology and properties of engineering surfaces. The subject matter is a central issue in manufacturing technology, since the quality and reliability of manufactured components depend greatly upon the selection and qualities of the appropriate materials as ascertained through measurement. The book can in broad terms be split into two parts; the first deals with the metrology of engineering surfaces and covers the important issues relating to the measurement and characterization of surfaces in both two and three dimensions. This covers topics such as filtering, power spectral densities, autocorrelation functions and the use of Fractals in topography. A significant proportion is dedicated to the calibration of scanning probe microscopes using the latest techniques. The remainder of the book deals with the properties of engineering surfaces and covers a w...

  4. Emerging trends in surface metrology

    Lonardo, P.M.; Lucca, D.A.; De Chiffre, Leonardo

    2002-01-01

    Recent advancements and some emerging trends in the methods and instruments used for surface and near surface characterisation are presented, considering the measurement of both topography and physical properties. In particular, surfaces that present difficulties in measurement or require new...... procedures are considered, with emphasis on measurements approaching the nanometre scale. Examples of new instruments and promising innovations for roughness measurement and surface integrity characterisation are presented. The new needs for tolerancing, traceability and calibration are also addressed....

  5. Applications of surface metrology in firearm identification

    Zheng, X; Soons, J; Vorburger, T V; Song, J; Renegar, T; Thompson, R

    2014-01-01

    Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a hard surface, the tool, comes into contact with a softer surface and causes plastic deformation. Toolmarks are commonly found on fired bullets and cartridge cases. Trained firearms examiners use these toolmarks to link an evidence bullet or cartridge case to a specific firearm, which can lead to a criminal conviction. Currently, identification is typically based on qualitative visual comparison by a trained examiner using a comparison microscope. In 2009, a report by the National Academies called this method into question. Amongst other issues, they questioned the objectivity of visual toolmark identification by firearms examiners. The National Academies recommended the development of objective toolmark identification criteria and confidence limits. The National Institute of Standards and Technology (NIST) have applied its experience in surface metrology to develop objective identification criteria, measurement methods, and reference artefacts for toolmark identification. NIST developed the Standard Reference Material SRM 2460 standard bullet and SRM 2461 standard cartridge case to facilitate quality control and traceability of identifications performed in crime laboratories. Objectivity is improved through measurement of surface topography and application of unambiguous surface similarity metrics, such as the maximum value (ACCF MAX ) of the areal cross correlation function. Case studies were performed on consecutively manufactured tools, such as gun barrels and breech faces, to demonstrate that, even in this worst case scenario, all the tested tools imparted unique surface topographies that were identifiable. These studies provide scientific support for toolmark evidence admissibility in criminal court cases. (paper)

  6. Profile variation impact on FIB cross-section metrology

    Cordes, Aaron; Bunday, Benjamin; Nadeau, Jim

    2012-03-01

    The focused ion beam (FIB) milling tool is an important component of reference metrology and process characterization, both as a supporting instrument for bulk sample preparation before forwarding to the transmission electron microscope (TEM) and other instruments and as an in situ measurement instrument using angled scanning electron microscopy. As features grow denser, deeper and more demanding, full-profile reference metrology is needed, and this methodology will only grow in importance. Thus, the ability to extract accurate dimensional and profile information out of the crosssectional faces produced by FIB milling is critical. For features that demonstrate perfect symmetry in the plane of the cross section, analyzing images and extracting metrology data are straightforward. However, for industrial materials, symmetry is not a safe assumption: as features shrink, the line edge and sidewall roughness increases as a percentage of the overall feature dimension. Furthermore, with the introduction of more complex architectures such as 3D memory and FinFETs, the areas of greatest interest, such as the intersections of wrap-around gates, cannot be assumed to be symmetrical in any given plane if cut placement is not precisely controlled. Therefore it is important to establish the exact location and repeatability of the cross-section plane, both in terms of coordinate placement and effective angle of the milled surface. To this end, we prepared designed-in line edge roughness samples in the Albany Nanotech facility using SEMATECH's AMAG6 metrology reticle. The samples were thoroughly characterized before being milled by a non-destructive, sidewall-scanning atomic force microscope (AFM). These samples are then milled and measured under varying process and setup parameters using a single-beam FIB with angled SEM. We established methodologies that allow precise alignment of the cut planes of slice-and-view FIB milling to 3D-AFM scan lines to compare repeated sections

  7. Welcome to Surface Topography: Metrology and Properties

    Leach, Richard

    2013-11-01

    I am delighted to welcome readers to this inaugural issue of Surface Topography: Metrology and Properties (STMP). In these days of citation indexes and academic reviews, it is a tough, and maybe a brave, job to start a new journal. But the subject area has never been more active and we are seeing genuine breakthroughs in the use of surfaces to control functional performance. Most manufactured parts rely on some form of control of their surface characteristics. The surface is usually defined as that feature on a component or device, which interacts with either the environment in which it is housed (or in which the device operates), or with another surface. The surface topography and material characteristics of a part can affect how fluids interact with it, how the part looks and feels and how two bearing parts will slide together. The need to control, and hence measure, surface features is becoming increasingly important as we move into a miniaturized world. Surface features can become the dominant functional features of a part and may become large in comparison to the overall size of an object. Research into surface texture measurement and characterization has been carried out for over a century and is now more active than ever, especially as new areal surface texture specification standards begin to be introduced. The range of disciplines for which the function of a surface relates to its topography is very diverse; from metal sheet manufacturing to art restoration, from plastic electronics to forensics. Until now, there has been no obvious publishing venue to bring together all these applications with the underlying research and theory, or to unite those working in academia with engineering and industry. Hence the creation of Surface Topography: Metrology and Properties . STMP will publish the best work being done across this broad discipline in one journal, helping researchers to share common themes and highlighting and promoting the extraordinary benefits this

  8. Reconstruction of freeform surfaces for metrology

    El-Hayek, N; Nouira, H; Anwer, N; Damak, M; Gibaru, O

    2014-01-01

    The application of freeform surfaces has increased since their complex shapes closely express a product's functional specifications and their machining is obtained with higher accuracy. In particular, optical surfaces exhibit enhanced performance especially when they take aspheric forms or more complex forms with multi-undulations. This study is mainly focused on the reconstruction of complex shapes such as freeform optical surfaces, and on the characterization of their form. The computer graphics community has proposed various algorithms for constructing a mesh based on the cloud of sample points. The mesh is a piecewise linear approximation of the surface and an interpolation of the point set. The mesh can further be processed for fitting parametric surfaces (Polyworks ® or Geomagic ® ). The metrology community investigates direct fitting approaches. If the surface mathematical model is given, fitting is a straight forward task. Nonetheless, if the surface model is unknown, fitting is only possible through the association of polynomial Spline parametric surfaces. In this paper, a comparative study carried out on methods proposed by the computer graphics community will be presented to elucidate the advantages of these approaches. We stress the importance of the pre-processing phase as well as the significance of initial conditions. We further emphasize the importance of the meshing phase by stating that a proper mesh has two major advantages. First, it organizes the initially unstructured point set and it provides an insight of orientation, neighbourhood and curvature, and infers information on both its geometry and topology. Second, it conveys a better segmentation of the space, leading to a correct patching and association of parametric surfaces

  9. Absolute surface reconstruction by slope metrology and photogrammetry

    Dong, Yue

    Developing the manufacture of aspheric and freeform optical elements requires an advanced metrology method which is capable of inspecting these elements with arbitrary freeform surfaces. In this dissertation, a new surface measurement scheme is investigated for such a purpose, which is to measure the absolute surface shape of an object under test through its surface slope information obtained by photogrammetric measurement. A laser beam propagating toward the object reflects on its surface while the vectors of the incident and reflected beams are evaluated from the four spots they leave on the two parallel transparent windows in front of the object. The spots' spatial coordinates are determined by photogrammetry. With the knowledge of the incident and reflected beam vectors, the local slope information of the object surface is obtained through vector calculus and finally yields the absolute object surface profile by a reconstruction algorithm. An experimental setup is designed and the proposed measuring principle is experimentally demonstrated by measuring the absolute surface shape of a spherical mirror. The measurement uncertainty is analyzed, and efforts for improvement are made accordingly. In particular, structured windows are designed and fabricated to generate uniform scattering spots left by the transmitted laser beams. Calibration of the fringe reflection instrument, another typical surface slope measurement method, is also reported in the dissertation. Finally, a method for uncertainty analysis of a photogrammetry measurement system by optical simulation is investigated.

  10. Forensic surface metrology: tool mark evidence.

    Gambino, Carol; McLaughlin, Patrick; Kuo, Loretta; Kammerman, Frani; Shenkin, Peter; Diaczuk, Peter; Petraco, Nicholas; Hamby, James; Petraco, Nicholas D K

    2011-01-01

    Over the last several decades, forensic examiners of impression evidence have come under scrutiny in the courtroom due to analysis methods that rely heavily on subjective morphological comparisons. Currently, there is no universally accepted system that generates numerical data to independently corroborate visual comparisons. Our research attempts to develop such a system for tool mark evidence, proposing a methodology that objectively evaluates the association of striated tool marks with the tools that generated them. In our study, 58 primer shear marks on 9 mm cartridge cases, fired from four Glock model 19 pistols, were collected using high-resolution white light confocal microscopy. The resulting three-dimensional surface topographies were filtered to extract all "waviness surfaces"-the essential "line" information that firearm and tool mark examiners view under a microscope. Extracted waviness profiles were processed with principal component analysis (PCA) for dimension reduction. Support vector machines (SVM) were used to make the profile-gun associations, and conformal prediction theory (CPT) for establishing confidence levels. At the 95% confidence level, CPT coupled with PCA-SVM yielded an empirical error rate of 3.5%. Complementary, bootstrap-based computations for estimated error rates were 0%, indicating that the error rate for the algorithmic procedure is likely to remain low on larger data sets. Finally, suggestions are made for practical courtroom application of CPT for assigning levels of confidence to SVM identifications of tool marks recorded with confocal microscopy. Copyright © 2011 Wiley Periodicals, Inc.

  11. Mirror surface metrology and polishing for AXAF/TMA

    Slomba, A.; Babish, R.; Glenn, P.

    1985-01-01

    The achievement of the derived goals for mirror surface quality on the Advanced X-ray Astrophysics Facility (AXAF), Technology Mirror Assembly (TMA) required a combination of state-of-the-art metrology and polishing techniques. In this paper, the authors summarize the derived goals and cover the main facets of the various metrology instruments employed, as well as the philosophy and technique used in the polishing work. In addition, they show how progress was measured against the goals, using the detailed error budget for surface errors and a mathematical model for performance prediction. The metrology instruments represented a considerable advance on the state-of-the-art and fully satisfied the error budget goals for the various surface errors. They were capable of measuring the surface errors over a large range of spatial periods, from low-frequency figure errors to microroughness. The polishing was accomplished with a computer-controlled process, guided by the combined data from various metrology instruments. This process was also tailored to reduce the surface errors over the full range of spatial periods

  12. Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler

    Sheung, Janet; Qian, Jun; Sullivan, Joseph; Thomasset, Muriel; Manton, Jonathan; Bean, Sunil; Takacs, Peter; Dvorak, Joseph; Assoufid, Lahsen

    2017-09-01

    As resolving power targets have increased with each generation of beamlines commissioned in synchrotron radiation facilities worldwide, diffraction gratings are quickly becoming crucial optical components for meeting performance targets. However, the metrology of variable-line-spacing (VLS) gratings for high resolution beamlines is not widespread; in particular, no metrology facility at any US DOE facility is currently equipped to fully characterize such gratings. To begin to address this issue, the Optics Group at the Advanced Photon Source at Argonne, in collaboration with SOLEIL and with support from Brookhaven National Laboratory (BNL), has developed an alternative beam path addition to the Long Trace Profiler (LTP) at Argonne's Advanced Photon Source. This significantly expands the functionality of the LTP not only to measure mirrors surface slope profile at normal incidence, but also to characterize the groove density of VLS diffraction gratings in the Littrow incidence up to 79°, which covers virtually all diffraction gratings used at synchrotrons in the first order. The LTP light source is a 20mW HeNe laser, which yields enough signal for diffraction measurements to be performed on low angle blazed gratings optimized for soft X-ray wavelengths. We will present the design of the beam path, technical requirements for the optomechanics, and our data analysis procedure. Finally, we discuss challenges still to be overcome and potential limitations with use of the LTP to perform metrology on diffraction gratings.

  13. Surface Slope Metrology on Deformable Soft X-ray Mirrors

    Yuan, Sheng; Yashchuk, Valeriy V.; Goldberg, Kenneth A.; Celestre, Rich; Church, Matthew; McKinney, Wayne R.; Morrison, Greg; Warwick, Tony

    2010-01-01

    We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situ visible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

  14. Surface Slope Metrology on Deformable Soft X-ray Mirrors

    Yuan, S.; Yashchuk, V.V.; Goldberg, K.A.; Celestre, R.; Church, M.; McKinney, W.R.; Morrison, G.; Warwick, T.

    2009-01-01

    We report on the current state of surface slope metrology on deformable mirrors for soft x-rays at the Advanced Light Source (ALS). While we are developing techniques for in situ at-wavelength tuning, we are refining methods of ex situvisible-light optical metrology to achieve sub-100-nrad accuracy. This paper reports on laboratory studies, measurements and tuning of a deformable test-KB mirror prior to its use. The test mirror was bent to a much different optical configuration than its original design, achieving a 0.38 micro-radian residual slope error. Modeling shows that in some cases, by including the image conjugate distance as an additional free parameter in the alignment, along with the two force couples, fourth-order tangential shape errors (the so-called bird shape) can be reduced or eliminated.

  15. Metrology aspects of SIMS depth profiling for advanced ULSI processes

    Budrevich, Andre; Hunter, Jerry

    1998-01-01

    As the semiconductor industry roadmap passes through the 0.1 μm technology node, the junction depth of the transistor source/drain extension will be required to be less than 20 nm and the well doping will be near 1.0 μm in depth. The development of advanced ULSI processing techniques requires the evolution of new metrology tools to ensure process capability. High sensitivity (ppb) coupled with excellent depth resolution (1 nm) makes SIMS the technique of choice for measuring the in-depth chemical distribution of these dopants with high precision and accuracy. This paper will discuss the issues, which impact the accuracy and precision of SIMS measurements of ion implants (both shallow and deep). First this paper will discuss common uses of the SIMS technique in the technology development and manufacturing of advanced ULSI processes. In the second part of this paper the ability of SIMS to make high precision measurements of ion implant depth profiles will be studied

  16. Precision metrology of NSTX surfaces using coherent laser radar ranging

    Kugel, H.W.; Loesser, D.; Roquemore, A. L.; Menon, M. M.; Barry, R. E.

    2000-01-01

    A frequency modulated Coherent Laser Radar ranging diagnostic is being used on the National Spherical Torus Experiment (NSTX) for precision metrology. The distance (range) between the 1.5 microm laser source and the target is measured by the shift in frequency of the linearly modulated beam reflected off the target. The range can be measured to a precision of < 100microm at distances of up to 22 meters. A description is given of the geometry and procedure for measuring NSTX interior and exterior surfaces during open vessel conditions, and the results of measurements are elaborated

  17. In-Situ Extended Lateral Range Surface Metrology, Phase I

    National Aeronautics and Space Administration — We propose to develop an extended lateral range capability for a dynamic optical profiling system to enable non-contact, surface roughness measurement of large and...

  18. Statistical and signal-processing concepts in surface metrology

    Church, E.L.; Takacs, P.Z.

    1986-03-01

    This paper proposes the use of a simple two-scale model of surface roughness for testing and specifying the topographic figure and finish of synchrotron-radiation mirrors. In this approach the effects of figure and finish are described in terms of their slope distribution and power spectrum, respectively, which are then combined with the system point spread function to produce a composite image. The result can be used to predict mirror performance or to translate design requirements into manufacturing specifications. Pacing problems in this approach are the development of a practical long-trace slope-profiling instrument and realistic statistical models for figure and finish errors

  19. Statistical and signal-processing concepts in surface metrology

    Church, E.L.; Takacs, P.Z.

    1986-03-01

    This paper proposes the use of a simple two-scale model of surface roughness for testing and specifying the topographic figure and finish of synchrotron-radiation mirrors. In this approach the effects of figure and finish are described in terms of their slope distribution and power spectrum, respectively, which are then combined with the system point spread function to produce a composite image. The result can be used to predict mirror performance or to translate design requirements into manufacturing specifications. Pacing problems in this approach are the development of a practical long-trace slope-profiling instrument and realistic statistical models for figure and finish errors.

  20. Coherent double-color interference microscope for traceable optical surface metrology

    Malinovski, I.; França, R. S.; Bessa, M. S.; Silva, C. R.; Couceiro, I. B.

    2016-06-01

    Interference microscopy is an important field of dimensional surface metrology because it provides direct traceability of the measurements to the SI base unit definition of the metre. With a typical measurement range from micrometres to nanometres interference microscopy (IM) covers the gap between classic metrology and nanometrology, providing continuous transfer of dimensional metrology into new areas of nanoscience and nanotechnology. Therefore IM is considered to be an indispensable tool for traceable transfer of the metre unit to different instruments. We report here the metrological study of an absolute Linnik interference microscope (IM) based on two frequency stabilized lasers. The design permits the flexible use of both lasers for measurements depending on the demand of the concrete measurement task. By principle of operation IM is combination of imaging and phase-shifting interferometry (PSI). The traceability is provided by the wavelength reference, that is, a He-Ne 633 nm stabilized laser. The second laser source, that is, a Blue-Green 488 nm grating stabilized laser diode, is used for improvements of resolution, and also for resolving integer fringe discontinuities on sharp features of the surface. The IM was optimized for surface height metrology. We have performed the study of the systematic effects of the measurements. This study allowed us to improve the hardware and software of IM and to find corrections for main systematic errors. The IM is purposed for 1D to 3D height metrology and surface topography in an extended range from nanometres to micrometres. The advantages and disadvantages of the design and developed methods are discussed.

  1. Coherent double-color interference microscope for traceable optical surface metrology

    Malinovski, I; França, R S; Bessa, M S; Silva, C R; Couceiro, I B

    2016-01-01

    Interference microscopy is an important field of dimensional surface metrology because it provides direct traceability of the measurements to the SI base unit definition of the metre. With a typical measurement range from micrometres to nanometres interference microscopy (IM) covers the gap between classic metrology and nanometrology, providing continuous transfer of dimensional metrology into new areas of nanoscience and nanotechnology. Therefore IM is considered to be an indispensable tool for traceable transfer of the metre unit to different instruments. We report here the metrological study of an absolute Linnik interference microscope (IM) based on two frequency stabilized lasers. The design permits the flexible use of both lasers for measurements depending on the demand of the concrete measurement task. By principle of operation IM is combination of imaging and phase-shifting interferometry (PSI). The traceability is provided by the wavelength reference, that is, a He-Ne 633 nm stabilized laser. The second laser source, that is, a Blue-Green 488 nm grating stabilized laser diode, is used for improvements of resolution, and also for resolving integer fringe discontinuities on sharp features of the surface. The IM was optimized for surface height metrology. We have performed the study of the systematic effects of the measurements. This study allowed us to improve the hardware and software of IM and to find corrections for main systematic errors. The IM is purposed for 1D to 3D height metrology and surface topography in an extended range from nanometres to micrometres. The advantages and disadvantages of the design and developed methods are discussed. (paper)

  2. True-color 3D surface metrology for additive manufacturing using interference microscopy

    DiSciacca, Jack; Gomez, Carlos; Thompson, Adam; Lawes, Simon; Leach, Richard; Colonna de Lega, Xavier; de Groot, Peter

    2017-01-01

    Coherence scanning interferometry (CSI) is widely used for surface topography characterisation. With the ability to measure both rough surfaces with the high slopes and optical finishes, CSI has made contibutions in fields from industrial machining to optical fabrication and polishing [1,2]. While the low coherence sources for CSI are typically broadband and suitable for color imaging, the metrology is usually performed without regards for the color information [3]. We present color surface t...

  3. Metrology of nanosize biopowders using porous silicon surface

    Zhuravel', L.V.; Latukhina, N.V.; Pisareva, E.V.; Vlasov, M.Yu.; Volkov, A.V.; Volodkin, B.O.

    2008-01-01

    Powders of hydroxyapatite deposited on porous silicon surface were investigated by TEM and STM methods. Thickness of porous lay was 1-100 micrometers; porous diameter was 0.01-10 micrometers. Images of porous silicon surface with deposited particles give possibility to estimate particles size and induce that only proportionate porous diameter particles have good adhesion to porous silicon surface.

  4. Metrology of sub-micron structured polymer surfaces

    Quagliotti, Danilo; Tosello, Guido; Salaga, J.

    metal masters with different types of finish has been carried out.Four types of surface finish were considered: a) Diamond buff polishing. b) Grit paper polishing. c) Stone polishing. d) Dry blast polishing (see Fig. 1). Both master and replicated surfaces were measured using a laser scanning confocal...... of about 70 %. The worst amplitude replication was achieved for both diamond buff and grit paper polished surfaces with a replication fidelity around 50 %.The tendency is almost the same for slope replication but the replication fidelity values are lower: 70 % for stone polished surfaces. 50 % for dry...... evaluated according to ISO 15530-3:2011, adapted to optical measure-ments, and propagated to the replication fidelity.A good amplitude replication was achieved for stone polished surfaces with a replication fidelity larger than 90 %. The dry blast ones were evaluated with an amplitude replication fidelity...

  5. Surface slope metrology of highly curved x-ray optics with an interferometric microscope

    Gevorkyan, Gevork S.; Centers, Gary; Polonska, Kateryna S.; Nikitin, Sergey M.; Lacey, Ian; Yashchuk, Valeriy V.

    2017-09-01

    The development of deterministic polishing techniques has given rise to vendors that manufacture high quality threedimensional x-ray optics. The surface metrology on these optics remains a difficult task. For the fabrication, vendors usually use unique surface metrology tools, generally developed on site, that are not available in the optical metrology labs at x-ray facilities. At the Advanced Light Source X-Ray Optics Laboratory, we have developed a rather straightforward interferometric-microscopy-based procedure capable of sub microradian characterization of sagittal slope variation of x-ray optics for two-dimensionally focusing and collimating (such as ellipsoids, paraboloids, etc.). In the paper, we provide the mathematical foundation of the procedure and describe the related instrument calibration. We also present analytical expression describing the ideal surface shape in the sagittal direction of a spheroid specified by the conjugate parameters of the optic's beamline application. The expression is useful when analyzing data obtained with such optics. The high efficiency of the developed measurement and data analysis procedures is demonstrated in results of measurements with a number of x-ray optics with sagittal radius of curvature between 56 mm and 480 mm. We also discuss potential areas of further improvement.

  6. Forensic Examination Using a Nondestructive Evaluation Method for Surface Metrology

    Eisenmann, David J.; Chumbley, L. Scott

    2009-03-01

    The objective of this paper is to describe the use of a new technique of optical profilometry in a nondestructive, non-contact fashion for the comparison of two metallic surfaces, one hard and one soft. When brought in contact with one another, the harder material (i.e. the tool) will impress its surface roughness onto the softer. It is understood that the resulting set of impressions left from a tool tip act in a manner similar to a photographic negative, in that it leaves a reverse, or negative impression on the surface of a plate. If properly inverted and reversed, measurements from the softer material should be identical to the harder indenting object with regard to surface texture and roughness. This assumption is inherent in the area of forensics, where bullets, cartridge cases, and toolmarked surfaces from crime scenes are compared to similar marks made under controlled conditions in the forensic laboratory. This paper will examine the methodology used to compare two surfaces for similarities and dissimilarities, and comment on the applicability of this technique to other studies.

  7. A 3D edge detection technique for surface extraction in computed tomography for dimensional metrology applications

    Yagüe-Fabra, J.A.; Ontiveros, S.; Jiménez, R.

    2013-01-01

    Many factors influence the measurement uncertainty when using computed tomography for dimensional metrology applications. One of the most critical steps is the surface extraction phase. An incorrect determination of the surface may significantly increase the measurement uncertainty. This paper...... presents an edge detection method for the surface extraction based on a 3D Canny algorithm with sub-voxel resolution. The advantages of this method are shown in comparison with the most commonly used technique nowadays, i.e. the local threshold definition. Both methods are applied to reference standards...

  8. Fast and accurate: high-speed metrological large-range AFM for surface and nanometrology

    Dai, Gaoliang; Koenders, Ludger; Fluegge, Jens; Hemmleb, Matthias

    2018-05-01

    Low measurement speed remains a major shortcoming of the scanning probe microscopic technique. It not only leads to a low measurement throughput, but a significant measurement drift over the long measurement time needed (up to hours or even days). To overcome this challenge, PTB, the national metrology institute of Germany, has developed a high-speed metrological large-range atomic force microscope (HS Met. LR-AFM) capable of measuring speeds up to 1 mm s‑1. This paper has introduced the design concept in detail. After modelling scanning probe microscopic measurements, our results suggest that the signal spectrum of the surface to be measured is the spatial spectrum of the surface scaled by the scanning speed. The higher the scanning speed , the broader the spectrum to be measured. To realise an accurate HS Met. LR-AFM, our solution is to combine different stages/sensors synchronously in measurements, which provide a much larger spectrum area for high-speed measurement capability. Two application examples have been demonstrated. The first is a new concept called reference areal surface metrology. Using the developed HS Met. LR-AFM, surfaces are measured accurately and traceably at a speed of 500 µm s‑1 and the results are applied as a reference 3D data map of the surfaces. By correlating the reference 3D data sets and 3D data sets of tools under calibration, which are measured at the same surface, it has the potential to comprehensively characterise the tools, for instance, the spectrum properties of the tools. The investigation results of two commercial confocal microscopes are demonstrated, indicating very promising results. The second example is the calibration of a kind of 3D nano standard, which has spatially distributed landmarks, i.e. special unique features defined by 3D-coordinates. Experimental investigations confirmed that the calibration accuracy is maintained at a measurement speed of 100 µm s‑1, which improves the calibration efficiency by a

  9. Measurement range of phase retrieval in optical surface and wavefront metrology

    Brady, Gregory R.; Fienup, James R.

    2009-01-01

    Phase retrieval employs very simple data collection hardware and iterative algorithms to determine the phase of an optical field. We have derived limitations on phase retrieval, as applied to optical surface and wavefront metrology, in terms of the speed of beam (i.e., f-number or numerical aperture) and amount of aberration using arguments based on sampling theory and geometrical optics. These limitations suggest methodologies for expanding these ranges by increasing the complexity of the measurement arrangement, the phase-retrieval algorithm, or both. We have simulated one of these methods where a surface is measured at unusual conjugates

  10. Albuquerque Regional Training: The Third Seminar on Surface Metrology for the Americas May 12-13 2014

    Tran, Sophie M [Florida State Univ., Tallahassee, FL (United States); Tran, Hy D. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2014-07-01

    The Third Seminar on Surface Metrology for the Americas (SSMA) took place in Albuquerque, New Mexico May 12-13, 2014. The conference was at the Marriott Hotel, in the heart of Albuquerque Uptown, within walking distance of many fantastic restaurants. Why surface metrology? Ask Professor Chris Brown of Worcester Polytechnic Institute (WPI), the chair of the first two SSMAs in 2011 and 2012 and the chair of the ASME B46 committee on classification and designation of surface qualities, and Professor Brown responds: “Because surfaces cover everything.”

  11. Picometre and nanoradian heterodyne interferometry and its application in dilatometry and surface metrology

    Schuldt, T; Kögel, H; Spannagel, R; Braxmaier, C; Gohlke, M; Peters, A; Johann, U; Weise, D

    2012-01-01

    A high-sensitivity heterodyne interferometer implementing differential wavefront sensing for tilt measurement was developed over the last few years. With this setup, using an aluminium breadboard and compact optical mounts with a beam height of 2 cm, noise levels less than 5 pm Hz −1/2 in translation and less than 10 nrad Hz −1/2 in tilt measurement, both for frequencies above 10 −2 Hz, have been demonstrated. Here, a new, compact and ruggedized interferometer setup utilizing a baseplate made of Zerodur, a thermally and mechanically highly stable glass ceramic with a coefficient of thermal expansion (CTE) of 2 × 10 −8 K −1 , is presented. The optical components are fixed to the baseplate using a specifically developed, easy-to-handle, assembly-integration technology based on a space-qualified two-component epoxy. While developed as a prototype for future applications aboard satellite space missions (such as Laser Interferometer Space Antenna), the interferometer is used in laboratory experiments for dilatometry and surface metrology. A first dilatometer setup with a demonstrated accuracy of 10 −7 K −1 in CTE measurement was realized. As it was seen that the accuracy is limited by the dimensional stability of the sample tube support, a new setup was developed utilizing Zerodur as structural material for the sample tube support. In another activity, the interferometer is used for characterization of high-quality mirror surfaces at the picometre level and for high-accuracy two-dimensional surface characterization in a prototype for industrial applications. In this paper, the corresponding designs, their realizations and first measurements of both applications in dilatometry and surface metrology are presented

  12. PREFACE: 14th International Conference on Metrology and Properties of Engineering Surfaces (Met & Props 2013)

    Fu, Wei-En

    2014-03-01

    hospitality. It is my privilege and pleasure to welcome you all to the 14th International Conference on Metrology and Properties of Engineering Surfaces here in Taipei. Tom Thomas Halmstad, 1st June 2013 Greetings from Chairman of Local Organizing CommitteeVictor Lin It is the great honor of Center for Measurement Standards (CMS), metrology group of Industrial Technology Research Institute (ITRI), to host the 14th International Conference on Metrology and Properties of Engineering Surfaces (Met & Props 2013) from 17-21 June, 2013, in Taipei, Taiwan. In collaboration with four local universities, National Taiwan University (NTU), National Cheng-Kung University (NCKU), National Taiwan University of Science and Technology (NTST) and National Tsing-Hua University (NTHU), we have spent more than one year to prepare this Conference since the approval by the International Programme Committee (IPC). With the guidance from the IPC, we are able to go through the laborious, but important, process of paper selection and review from more than 100 submissions, and also to maintain the tradition in gathering the high quality and state-of-the-art papers. Finally, more than 65 full papers are collected in the programme (oral and poster), and over 120 surface metrologists from 17 countries (or economies) will attend the Conference. As stated in the preface by Professor Thomas, this series of conferences were founded by Tom and late Professor Ken Stout in the United Kingdom more than thirty years ago. I was lucky to join Ken's research group in Birmingham, and to start my journey over surface metrology in 1989, under the financial support from ITRI. With the encouragement from Professor Liam Blunt and endeavors of my colleagues, we are able to hold the Conference first time in emerging Asia, and to ''carry on the heritage and pave the way to the future'' (a Chinese proverb) in surface metrology. Taiwan is also known as Formosa, from Portuguese Ilha Formosa, which means ''Beautiful Island

  13. 3-D x-ray mirror metrology with a vertical scanning long trace profiler

    Takacs, P.Z.; Li, H.; Li, X.; Grindel, M.W.

    1996-01-01

    The long trace profiler (LTP) was originally developed at Brookhaven National Laboratory for the specific purpose of measuring the surface figure of large cylindrical mirrors used at grazing incidence in synchrotron radiation (SR) beamlines. In its original configuration, it could measure only along one line down the center of the cylinder. A single linear profile is often sufficient to gauge the quality of the optical surface on these kinds of mirrors. For some applications it is necessary to measure the topography of the entire surface, not just along one line but over a grid that covers the entire surface area. We have modified a standard LTP to enable measurement of the complete surface of Wolter telescope optics in a vertical configuration. The vertical scanning LTP (VSLTP) is capable of producing a complete 3-D map of the surface topography errors relative to the ideal desired surface on complete segments of paraboloids and hyperboloids. The instrument uses a penta prism assembly to scan the probe beam in the longitudinal direction parallel to the mirror symmetry axis and uses a precision rotary stage to provide scans in the azimuthal direction. A Risley prism pair and a dove prism are used to orient the probe beam in the proper direction for the azimuthal scans. The repeatability of the prototype instrument is better than 20 nm over trace lengths of 35 mm with a slope measurement accuracy of about 1 microradian. copyright 1996 American Institute of Physics

  14. Virtual environment assessment for laser-based vision surface profiling

    ElSoussi, Adnane; Al Alami, Abed ElRahman; Abu-Nabah, Bassam A.

    2015-03-01

    Oil and gas businesses have been raising the demand from original equipment manufacturers (OEMs) to implement a reliable metrology method in assessing surface profiles of welds before and after grinding. This certainly mandates the deviation from the commonly used surface measurement gauges, which are not only operator dependent, but also limited to discrete measurements along the weld. Due to its potential accuracy and speed, the use of laser-based vision surface profiling systems have been progressively rising as part of manufacturing quality control. This effort presents a virtual environment that lends itself for developing and evaluating existing laser vision sensor (LVS) calibration and measurement techniques. A combination of two known calibration techniques is implemented to deliver a calibrated LVS system. System calibration is implemented virtually and experimentally to scan simulated and 3D printed features of known profiles, respectively. Scanned data is inverted and compared with the input profiles to validate the virtual environment capability for LVS surface profiling and preliminary assess the measurement technique for weld profiling applications. Moreover, this effort brings 3D scanning capability a step closer towards robust quality control applications in a manufacturing environment.

  15. Spectral and parameter estimation problems arising in the metrology of high performance mirror surfaces

    Church, E.L.; Takacs, P.Z.

    1986-04-01

    The accurate characterization of mirror surfaces requires the estimation of two-dimensional distribution functions and power spectra from trend-contaminated profile measurements. The rationale behind this, and our measurement and processing procedures, are described. The distinction between profile and area spectra is indicated, and since measurements often suggest inverse-power-law forms, a discussion of classical and fractal models of processes leading to these forms is included. 9 refs

  16. Metrological issues related to BRDF measurements around the specular direction in the particular case of glossy surfaces

    Obein, Gaël.; Audenaert, Jan; Ged, Guillaume; Leloup, Frédéric B.

    2015-03-01

    Among the complete bidirectional reflectance distribution function (BRDF), visual gloss is principally related to physical reflection characteristics located around the specular reflection direction. This particular part of the BRDF is usually referred to as the specular peak. A good starting point for the physical description of gloss could be to measure the reflection properties around this specular peak. Unfortunately, such a characterization is not trivial, since for glossy surfaces the width of the specular peak can become very narrow (typically a full width at half maximum inferior to 0.5° is encountered). In result, new BRDF measurement devices with a very small solid angle of detection are being introduced. Yet, differences in the optical design of BRDF measurement instruments engender different measurement results for the same specimen, complicating direct comparison of the measurement results. This issue is addressed in this paper. By way of example, BRDF measurement results of two samples, one being matte and the other one glossy, obtained by use of two high level goniospectrophotometers with a different optical design, are described. Important discrepancies in the results of the glossy sample are discussed. Finally, luminance maps obtained from renderings with the acquired BRDF data are presented, exemplifying the large visual differences that might be obtained. This stresses the metrological aspects that must be known for using BRDF data. Indeed, the comprehension of parameters affecting the measurement results is an inevitable step towards progress in the metrology of surface gloss, and thus towards a better metrology of appearance in general.

  17. Image-based overlay and alignment metrology through optically opaque media with sub-surface probe microscopy

    van Es, Maarten H.; Mohtashami, Abbas; Piras, Daniele; Sadeghian, Hamed

    2018-03-01

    Nondestructive subsurface nanoimaging through optically opaque media is considered to be extremely challenging and is essential for several semiconductor metrology applications including overlay and alignment and buried void and defect characterization. The current key challenge in overlay and alignment is the measurement of targets that are covered by optically opaque layers. Moreover, with the device dimensions moving to the smaller nodes and the issue of the so-called loading effect causing offsets between between targets and product features, it is increasingly desirable to perform alignment and overlay on product features or so-called on-cell overlay, which requires higher lateral resolution than optical methods can provide. Our recently developed technique known as SubSurface Ultrasonic Resonance Force Microscopy (SSURFM) has shown the capability for high-resolution imaging of structures below a surface based on (visco-)elasticity of the constituent materials and as such is a promising technique to perform overlay and alignment with high resolution in upcoming production nodes. In this paper, we describe the developed SSURFM technique and the experimental results on imaging buried features through various layers and the ability to detect objects with resolution below 10 nm. In summary, the experimental results show that the SSURFM is a potential solution for on-cell overlay and alignment as well as detecting buried defects or voids and generally metrology through optically opaque layers.

  18. On the evaluation of photogrammetric methods for dense 3D surface reconstruction in a metrological context

    Toschi, I.; Capra, A.; De Luca, L.; Beraldin, J.-A.; Cournoyer, L.

    2014-05-01

    This paper discusses a methodology to evaluate the accuracy of recently developed image-based 3D modelling techniques. So far, the emergence of these novel methods has not been supported by the definition of an internationally recognized standard which is fundamental for user confidence and market growth. In order to provide an element of reflection and solution to the different communities involved in 3D imaging, a promising approach is presented in this paper for the assessment of both metric quality and limitations of an open-source suite of tools (Apero/MicMac), developed for the extraction of dense 3D point clouds from a set of unordered 2D images. The proposed procedural workflow is performed within a metrological context, through inter-comparisons with "reference" data acquired with two hemispherical laser scanners, one total station, and one laser tracker. The methodology is applied to two case studies, designed in order to analyse the software performances in dealing with both outdoor and environmentally controlled conditions, i.e. the main entrance of Cathédrale de la Major (Marseille, France) and a custom-made scene located at National Research Council of Canada 3D imaging Metrology Laboratory (Ottawa). Comparative data and accuracy evidence produced for both tests allow the study of some key factors affecting 3D model accuracy.

  19. Synchrotron radiation and precision mirror metrology with a long trace profiler

    Qian, S.; Takacs, P.Z.

    1997-08-01

    The Long Trace Profiler (LTP) is in use at several synchrotron radiation (SR) laboratories throughout the world and by a number of manufacturers who specialize in making grazing incidence mirrors for SR customers. Recent improvements in the design and operation of the LTP system have reduced the slope profile error bar to the level of 0.3 microradians RMS over measurement lengths of 0.5 meter. This corresponds to a height error bar on the order of 20 nanometers. This level of performance allows one to measure with confidence the shape of large cylinders and spheres that have kilometer radii of curvature in the axial direction. The LTP is versatile enough to make measurements of a mirror in the face up, sideways, and face down configurations. The authors will illustrate the versatility of the current version of the instrument, the LTP II, and present results from two new versions of the instrument: the in-situ LTP (ISLTP) and the Vertical Scan LTP (VSLTP). Both of them are based on the penta-prism LTP (ppLTP) principle with a stationary optical head and moving penta-prism. The ISLTP is designed to measure the distortion of high heat load mirrors during actual operation in SR beam lines. The VSLTP is designed to measure the complete 3-dimensional shape of x-ray telescope cylinder mirrors and mandrels in a vertical configuration. Scans are done both in the axial direction and in the azimuthal direction

  20. Quantum metrology

    Xiang Guo-Yong; Guo Guang-Can

    2013-01-01

    The statistical error is ineluctable in any measurement. Quantum techniques, especially with the development of quantum information, can help us squeeze the statistical error and enhance the precision of measurement. In a quantum system, there are some quantum parameters, such as the quantum state, quantum operator, and quantum dimension, which have no classical counterparts. So quantum metrology deals with not only the traditional parameters, but also the quantum parameters. Quantum metrology includes two important parts: measuring the physical parameters with a precision beating the classical physics limit and measuring the quantum parameters precisely. In this review, we will introduce how quantum characters (e.g., squeezed state and quantum entanglement) yield a higher precision, what the research areas are scientists most interesting in, and what the development status of quantum metrology and its perspectives are. (topical review - quantum information)

  1. Radioactivity metrology

    Legrand, J.

    1979-01-01

    Some aspects of the radioactivity metrology are reviewed. Radioactivity primary references; absolute methods of radioactivity measurements used in the Laboratoire de Metrologie des Rayonnements Ionisants; relative measurement methods; traceability through international comparisons and interlaboratory tests; production and distribution of secondary standards [fr

  2. Correlation study of actual temperature profile and in-line metrology measurements for within-wafer uniformity improvement and wafer edge yield enhancement (Conference Presentation)

    Fang, Fang; Vaid, Alok; Vinslava, Alina; Casselberry, Richard; Mishra, Shailendra; Dixit, Dhairya; Timoney, Padraig; Chu, Dinh; Porter, Candice; Song, Da; Ren, Zhou

    2018-03-01

    It is getting more important to monitor all aspects of influencing parameters in critical etch steps and utilize them as tuning knobs for within-wafer uniformity improvement and wafer edge yield enhancement. Meanwhile, we took a dive in pursuing "measuring what matters" and challenged ourselves for more aspects of signals acquired in actual process conditions. Among these factors which are considered subtle previously, we identified Temperature, especially electrostatic chuck (ESC) Temperature measurement in real etch process conditions have direct correlation to in-line measurements. In this work, we used SensArray technique (EtchTemp-SE wafer) to measure ESC temperature profile on a 300mm wafer with plasma turning on to reproduce actual temperature pattern on wafers in real production process conditions. In field applications, we observed substantial correlation between ESC temperature and in-line optical metrology measurements and since temperature is a process factor that can be tuning through set-temperature modulations, we have identified process knobs with known impact on physical profile variations. Furthermore, ESC temperature profile on a 300mm wafer is configured as multiple zones upon radius and SensArray measurements mechanism could catch such zonal distribution as well, which enables detailed temperature modulations targeting edge ring only where most of chips can be harvested and critical zone for yield enhancement. Last but not least, compared with control reference (ESC Temperature in static plasma-off status), we also get additional factors to investigate in chamber-to-chamber matching study and make process tool fleet match on the basis really matters in production. KLA-Tencor EtchTemp-SE wafer enables Plasma On wafer temperature monitoring of silicon etch process. This wafer is wireless and has 65 sensors with measurement range from 20 to 140°C. the wafer is designed to run in real production recipe plasma on condition with maximum RF power up

  3. Optical micro-metrology of structured surfaces micro-machined by jet-ECM

    Quagliotti, Danilo; Tosello, Guido; Islam, Aminul

    2015-01-01

    A procedure for statistical analysis and uncertainty evaluation is presented with regards to measurements of step height and surface texture. Measurements have been performed with a focus-variation microscope over jet electrochemical micro-machined surfaces. Traceability has been achieved using a...

  4. Temperature metrology

    Fischer, J.; Fellmuth, B.

    2005-05-01

    The majority of the processes used by the manufacturing industry depend upon the accurate measurement and control of temperature. Thermal metrology is also a key factor affecting the efficiency and environmental impact of many high-energy industrial processes, the development of innovative products and the health and safety of the general population. Applications range from the processing, storage and shipment of perishable foodstuffs and biological materials to the development of more efficient and less environmentally polluting combustion processes for steel-making. Accurate measurement and control of temperature is, for instance, also important in areas such as the characterization of new materials used in the automotive, aerospace and semiconductor industries. This paper reviews the current status of temperature metrology. It starts with the determination of thermodynamic temperatures required on principle because temperature is an intensive quantity. Methods to determine thermodynamic temperatures are reviewed in detail to introduce the underlying physical basis. As these methods cannot usually be applied for practical measurements the need for a practical temperature scale for day-to-day work is motivated. The International Temperature Scale of 1990 and the Provisional Low Temperature Scale PLTS-2000 are described as important parts of the International System of Units to support science and technology. Its main importance becomes obvious in connection with industrial development and international markets. Every country is strongly interested in unique measures, in order to guarantee quality, reproducibility and functionability of products. The eventual realization of an international system, however, is only possible within the well-functioning organization of metrological laboratories. In developed countries the government established scientific institutes have certain metrological duties, as, for instance, the maintenance and dissemination of national

  5. Temperature metrology

    Fischer, J; Fellmuth, B

    2005-01-01

    The majority of the processes used by the manufacturing industry depend upon the accurate measurement and control of temperature. Thermal metrology is also a key factor affecting the efficiency and environmental impact of many high-energy industrial processes, the development of innovative products and the health and safety of the general population. Applications range from the processing, storage and shipment of perishable foodstuffs and biological materials to the development of more efficient and less environmentally polluting combustion processes for steel-making. Accurate measurement and control of temperature is, for instance, also important in areas such as the characterization of new materials used in the automotive, aerospace and semiconductor industries. This paper reviews the current status of temperature metrology. It starts with the determination of thermodynamic temperatures required on principle because temperature is an intensive quantity. Methods to determine thermodynamic temperatures are reviewed in detail to introduce the underlying physical basis. As these methods cannot usually be applied for practical measurements the need for a practical temperature scale for day-to-day work is motivated. The International Temperature Scale of 1990 and the Provisional Low Temperature Scale PLTS-2000 are described as important parts of the International System of Units to support science and technology. Its main importance becomes obvious in connection with industrial development and international markets. Every country is strongly interested in unique measures, in order to guarantee quality, reproducibility and functionability of products. The eventual realization of an international system, however, is only possible within the well-functioning organization of metrological laboratories. In developed countries the government established scientific institutes have certain metrological duties, as, for instance, the maintenance and dissemination of national

  6. Metrological Aspects of Surface Topographies Produced by Different Machining Operations Regarding Their Potential Functionality

    Żak Krzysztof

    2017-06-01

    Full Text Available This paper presents a comprehensive methodology for measuring and characterizing the surface topographies on machined steel parts produced by precision machining operations. The performed case studies concern a wide spectrum of topographic features of surfaces with different geometrical structures but the same values of the arithmetic mean height Sa. The tested machining operations included hard turning operations performed with CBN tools, grinding operations with Al2O3 ceramic and CBN wheels and superfinish using ceramic stones. As a result, several characteristic surface textures with the Sa roughness parameter value of about 0.2 μm were thoroughly characterized and compared regarding their potential functional capabilities. Apart from the standard 2D and 3D roughness parameters, the fractal, motif and frequency parameters were taken in the consideration.

  7. Airborne Surface Profiling of Alaskan Glaciers

    National Oceanic and Atmospheric Administration, Department of Commerce — This data set consists of glacier outline, laser altimetry profile, and surface elevation change data for 46 glaciers in Alaska and British Columbia, Canada,...

  8. Development of ballistics identification—from image comparison to topography measurement in surface metrology

    Song, J; Chu, W; Vorburger, T V; Thompson, R; Renegar, T B; Zheng, A; Yen, J; Silver, R; Ols, M

    2012-01-01

    Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current automated ballistics identification systems are primarily based on image comparisons using optical microscopy. The correlation accuracy depends on image quality which is largely affected by lighting conditions. Because ballistics signatures are geometrical micro-topographies by nature, direct measurement and correlation of the surface topography is being investigated for ballistics identification. A Two-dimensional and Three-dimensional Topography Measurement and Correlation System was developed at the National Institute of Standards and Technology for certification of Standard Reference Material 2460/2461 bullets and cartridge cases. Based on this system, a prototype system for bullet signature measurement and correlation has been developed for bullet signature identifications, and has demonstrated superior correlation results. (paper)

  9. SURFACE BRIGHTNESS PROFILES OF DWARF GALAXIES. I. PROFILES AND STATISTICS

    Herrmann, Kimberly A.; Hunter, Deidre A.; Elmegreen, Bruce G.

    2013-01-01

    Radial surface brightness profiles of spiral galaxies are classified into three types: (I) single exponential, or the light falls off with one exponential to a break before falling off (II) more steeply, or (III) less steeply. Profile breaks are also found in dwarf disks, but some dwarf Type IIs are flat or increasing out to a break before falling off. Here we re-examine the stellar disk profiles of 141 dwarfs: 96 dwarf irregulars (dIms), 26 Blue Compact Dwarfs (BCDs), and 19 Magellanic-type spirals (Sms). We fit single, double, or even triple exponential profiles in up to 11 passbands: GALEX FUV and NUV, ground-based UBVJHK and Hα, and Spitzer 3.6 and 4.5 μm. We find that more luminous galaxies have brighter centers, larger inner and outer scale lengths, and breaks at larger radii; dwarf trends with M B extend to spirals. However, the V-band break surface brightness is independent of break type, M B , and Hubble type. Dwarf Type II and III profiles fall off similarly beyond the breaks but have different interiors and IIs break ∼twice as far as IIIs. Outer Type II and III scale lengths may have weak trends with wavelength, but pure Type II inner scale lengths clearly decrease from the FUV to visible bands whereas Type III inner scale lengths increase with redder bands. This suggests the influence of different star formation histories on profile type, but nonetheless the break location is approximately the same in all passbands. Dwarfs continue trends between profile and Hubble types such that later-type galaxies have more Type II but fewer Type I and III profiles than early-type spirals. BCDs and Sms are over-represented as Types III and II, respectively, compared to dIms

  10. FOREWORD: Materials metrology Materials metrology

    Bennett, Seton; Valdés, Joaquin

    2010-04-01

    It seems that so much of modern life is defined by the materials we use. From aircraft to architecture, from cars to communications, from microelectronics to medicine, the development of new materials and the innovative application of existing ones have underpinned the technological advances that have transformed the way we live, work and play. Recognizing the need for a sound technical basis for drafting codes of practice and specifications for advanced materials, the governments of countries of the Economic Summit (G7) and the European Commission signed a Memorandum of Understanding in 1982 to establish the Versailles Project on Advanced Materials and Standards (VAMAS). This project supports international trade by enabling scientific collaboration as a precursor to the drafting of standards. The VAMAS participants recognized the importance of agreeing a reliable, universally accepted basis for the traceability of the measurements on which standards depend for their preparation and implementation. Seeing the need to involve the wider metrology community, VAMAS approached the Comité International des Poids et Mesures (CIPM). Following discussions with NMI Directors and a workshop at the BIPM in February 2005, the CIPM decided to establish an ad hoc Working Group on the metrology applicable to the measurement of material properties. The Working Group presented its conclusions to the CIPM in October 2007 and published its final report in 2008, leading to the signature of a Memorandum of Understanding between VAMAS and the BIPM. This MoU recognizes the work that is already going on in VAMAS as well as in the Consultative Committees of the CIPM and establishes a framework for an ongoing dialogue on issues of materials metrology. The question of what is meant by traceability in the metrology of the properties of materials is particularly vexed when the measurement results depend on a specified procedure. In these cases, confidence in results requires not only traceable

  11. Doping profile measurement on textured silicon surface

    Essa, Zahi; Taleb, Nadjib; Sermage, Bernard; Broussillou, Cédric; Bazer-Bachi, Barbara; Quillec, Maurice

    2018-04-01

    In crystalline silicon solar cells, the front surface is textured in order to lower the reflection of the incident light and increase the efficiency of the cell. This texturing whose dimensions are a few micrometers wide and high, often makes it difficult to determine the doping profile measurement. We have measured by secondary ion mass spectrometry (SIMS) and electrochemical capacitance voltage profiling the doping profile of implanted phosphorus in alkaline textured and in polished monocrystalline silicon wafers. The paper shows that SIMS gives accurate results provided the primary ion impact angle is small enough. Moreover, the comparison between these two techniques gives an estimation of the concentration of electrically inactive phosphorus atoms.

  12. Emerging technology for astronomical optics metrology

    Trumper, Isaac; Jannuzi, Buell T.; Kim, Dae Wook

    2018-05-01

    Next generation astronomical optics will enable science discoveries across all fields and impact the way we perceive the Universe in which we live. To build these systems, optical metrology tools have been developed that push the boundary of what is possible. We present a summary of a few key metrology technologies that we believe are critical for the coming generation of optical surfaces.

  13. Design of Softgauge for Surface Profile Evaluation

    Nie, M Q; Liu, X J; Jiang, X Q

    2006-01-01

    A concept of softgauge has been proposed by ISO in the context of surface texture measurement, in which reference software and reference data are included. In this paper, an effective scheme to build reference software for 2D surface profile measurement is proposed. The advantage of the scheme lies in its effective combination of high numerical calculating capability of MATLAB with perfect interface programming capability of VC. Preliminary reference software is developed, and typical algorithms are tested

  14. Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements

    Kumar, P.; Martin, H.; Jiang, X.

    2016-01-01

    Non-destructive testing and online measurement of surface features are pressing demands in manufacturing. Thus optical techniques are gaining importance for characterization of complex engineering surfaces. Harnessing integrated optics for miniaturization of interferometry systems onto a silicon wafer and incorporating a compact optical probe would enable the development of a handheld sensor for embedded metrology applications. In this work, we present the progress in the development of a hybrid photonics based metrology sensor device for online surface profile measurements. The measurement principle along with test and measurement results of individual components has been presented. For non-contact measurement, a spectrally encoded lateral scanning probe based on the laser scanning microscopy has been developed to provide fast measurement with lateral resolution limited to the diffraction limit. The probe demonstrates a lateral resolution of ∼3.6 μm while high axial resolution (sub-nanometre) is inherently achieved by interferometry. Further the performance of the hybrid tuneable laser and the scanning probe was evaluated by measuring a standard step height sample of 100 nm.

  15. Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements

    Kumar, P.; Martin, H.; Jiang, X. [EPSRC Centre for Innovative Manufacturing in Advanced Metrology, University of Huddersfield, Huddersfield HD1 3DH (United Kingdom)

    2016-06-15

    Non-destructive testing and online measurement of surface features are pressing demands in manufacturing. Thus optical techniques are gaining importance for characterization of complex engineering surfaces. Harnessing integrated optics for miniaturization of interferometry systems onto a silicon wafer and incorporating a compact optical probe would enable the development of a handheld sensor for embedded metrology applications. In this work, we present the progress in the development of a hybrid photonics based metrology sensor device for online surface profile measurements. The measurement principle along with test and measurement results of individual components has been presented. For non-contact measurement, a spectrally encoded lateral scanning probe based on the laser scanning microscopy has been developed to provide fast measurement with lateral resolution limited to the diffraction limit. The probe demonstrates a lateral resolution of ∼3.6 μm while high axial resolution (sub-nanometre) is inherently achieved by interferometry. Further the performance of the hybrid tuneable laser and the scanning probe was evaluated by measuring a standard step height sample of 100 nm.

  16. Exact analytical density profiles and surface tension

    journal of. May 2005 physics pp. 785–801. Classical charged fluids at equilibrium near ... is provided by the excess surface tension for an air–water interface, which is determined ... the potential drop created by the electric layer which appears as soon as the fluid has ...... radii, by symmetry, the charge density profile is flat,.

  17. Surface glycosylation profiles of urine extracellular vesicles.

    Jared Q Gerlach

    Full Text Available Urinary extracellular vesicles (uEVs are released by cells throughout the nephron and contain biomolecules from their cells of origin. Although uEV-associated proteins and RNA have been studied in detail, little information exists regarding uEV glycosylation characteristics. Surface glycosylation profiling by flow cytometry and lectin microarray was applied to uEVs enriched from urine of healthy adults by ultracentrifugation and centrifugal filtration. The carbohydrate specificity of lectin microarray profiles was confirmed by competitive sugar inhibition and carbohydrate-specific enzyme hydrolysis. Glycosylation profiles of uEVs and purified Tamm Horsfall protein were compared. In both flow cytometry and lectin microarray assays, uEVs demonstrated surface binding, at low to moderate intensities, of a broad range of lectins whether prepared by ultracentrifugation or centrifugal filtration. In general, ultracentrifugation-prepared uEVs demonstrated higher lectin binding intensities than centrifugal filtration-prepared uEVs consistent with lesser amounts of co-purified non-vesicular proteins. The surface glycosylation profiles of uEVs showed little inter-individual variation and were distinct from those of Tamm Horsfall protein, which bound a limited number of lectins. In a pilot study, lectin microarray was used to compare uEVs from individuals with autosomal dominant polycystic kidney disease to those of age-matched controls. The lectin microarray profiles of polycystic kidney disease and healthy uEVs showed differences in binding intensity of 6/43 lectins. Our results reveal a complex surface glycosylation profile of uEVs that is accessible to lectin-based analysis following multiple uEV enrichment techniques, is distinct from co-purified Tamm Horsfall protein and may demonstrate disease-specific modifications.

  18. Nanoelectronics: Metrology and Computation

    Lundstrom, Mark; Clark, Jason V.; Klimeck, Gerhard; Raman, Arvind

    2007-01-01

    Research in nanoelectronics poses new challenges for metrology, but advances in theory, simulation and computing and networking technology provide new opportunities to couple simulation and metrology. This paper begins with a brief overview of current work in computational nanoelectronics. Three examples of how computation can assist metrology will then be discussed. The paper concludes with a discussion of how cyberinfrastructure can help connect computing and metrology using the nanoHUB (www.nanoHUB.org) as a specific example

  19. Capability Handbook- offline metrology

    Islam, Aminul; Marhöfer, David Maximilian; Tosello, Guido

    This offline metrological capability handbook has been made in relation to HiMicro Task 3.3. The purpose of this document is to assess the metrological capability of the HiMicro partners and to gather the information of all available metrological instruments in the one single document. It provides...

  20. Reconstruction of mechanically recorded sound from an edison cylinder using three dimensional non-contact optical surface metrology

    Fadeyev, V.; Haber, C.; Maul, C.; McBride, J.W.; Golden, M.

    2004-04-20

    Audio information stored in the undulations of grooves in a medium such as a phonograph disc record or cylinder may be reconstructed, without contact, by measuring the groove shape using precision optical metrology methods and digital image processing. The viability of this approach was recently demonstrated on a 78 rpm shellac disc using two dimensional image acquisition and analysis methods. The present work reports the first three dimensional reconstruction of mechanically recorded sound. The source material, a celluloid cylinder, was scanned using color coded confocal microscopy techniques and resulted in a faithful playback of the recorded information.

  1. Atomic profile imaging of ceramic oxide surfaces

    Bursill, L.A.; Peng JuLin; Sellar, J.R.

    1989-01-01

    Atomic surface profile imaging is an electron optical technique capable of revealing directly the surface crystallography of ceramic oxides. Use of an image-intensifier with a TV camera allows fluctuations in surface morphology and surface reactivity to be recorded and analyzed using digitized image data. This paper reviews aspects of the electron optical techniques, including interpretations based upon computer-simulation image-matching techniques. An extensive range of applications is then presented for ceramic oxides of commercial interest for advanced materials applications: including uranium oxide (UO 2 ); magnesium and nickel oxide (MgO,NiO); ceramic superconductor YBa 2 Cu 3 O 6.7 ); barium titanate (BaTiO 3 ); sapphire (α-A1 2 O 3 ); haematite (α-Fe-2O 3 ); monoclinic, tetragonal and cubic monocrystalline forms of zirconia (ZrO 2 ), lead zirconium titanate (PZT + 6 mol.% NiNbO 3 ) and ZBLAN fluoride glass. Atomic scale detail has been obtained of local structures such as steps associated with vicinal surfaces, facetting parallel to stable low energy crystallographic planes, monolayer formation on certain facets, relaxation and reconstructions, oriented overgrowth of lower oxides, chemical decomposition of complex oxides into component oxides, as well as amorphous coatings. This remarkable variety of observed surface stabilization mechanisms is discussed in terms of novel double-layer electrostatic depolarization mechanisms, as well as classical concepts of the physics and chemistry of surfaces (ionization and affinity energies and work function). 46 refs., 16 figs

  2. DABAM: an open-source database of X-ray mirrors metrology

    Sanchez del Rio, Manuel, E-mail: srio@esrf.eu [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Bianchi, Davide [AC2T Research GmbH, Viktro-Kaplan-Strasse 2-C, 2700 Wiener Neustadt (Austria); Cocco, Daniele [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025 (United States); Glass, Mark [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Idir, Mourad [NSLS II, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Metz, Jim [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Raimondi, Lorenzo; Rebuffi, Luca [Elettra-Sincrotrone Trieste SCpA, Basovizza (TS) (Italy); Reininger, Ruben; Shi, Xianbo [Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States); Siewert, Frank [BESSY II, Helmholtz Zentrum Berlin, Institute for Nanometre Optics and Technology, Albert-Einstein-Strasse 15, 12489 Berlin (Germany); Spielmann-Jaeggi, Sibylle [Swiss Light Source at Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Takacs, Peter [Instrumentation Division, Brookhaven National Laboratory, Upton, NY 11973-5000 (United States); Tomasset, Muriel [Synchrotron Soleil (France); Tonnessen, Tom [InSync Inc., 2511C Broadbent Parkway, Albuquerque, NM 87107 (United States); Vivo, Amparo [ESRF - The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble (France); Yashchuk, Valeriy [Advanced Light Source, Lawrence Berkeley National Laboratory, MS 15-R0317, 1 Cyclotron Road, Berkeley, CA 94720-8199 (United States)

    2016-04-20

    DABAM, an open-source database of X-ray mirrors metrology to be used with ray-tracing and wave-propagation codes for simulating the effect of the surface errors on the performance of a synchrotron radiation beamline. An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal position in a beamline due to mirror surface errors. This database for metrology (DABAM) aims to provide to the users of simulation tools the data of real mirrors. The data included in the database are described in this paper, with details of how the mirror parameters are stored. An accompanying software is provided to allow simple access and processing of these data, calculate the most usual statistical parameters, and also include the option of creating input files for most used simulation codes. Some optics simulations are presented and discussed to illustrate the real use of the profiles from the database.

  3. Metrological large range scanning probe microscope

    Dai Gaoliang; Pohlenz, Frank; Danzebrink, Hans-Ulrich; Xu Min; Hasche, Klaus; Wilkening, Guenter

    2004-01-01

    We describe a metrological large range scanning probe microscope (LR-SPM) with an Abbe error free design and direct interferometric position measurement capability, aimed at versatile traceable topographic measurements that require nanometer accuracy. A dual-stage positioning system was designed to achieve both a large measurement range and a high measurement speed. This dual-stage system consists of a commercially available stage, referred to as nanomeasuring machine (NMM), with a motion range of 25 mmx25 mmx5 mm along x, y, and z axes, and a compact z-axis piezoelectric positioning stage (compact z stage) with an extension range of 2 μm. The metrological LR-SPM described here senses the surface using a stationary fixed scanning force microscope (SFM) head working in contact mode. During operation, lateral scanning of the sample is performed solely by the NMM. Whereas the z motion, controlled by the SFM signal, is carried out by a combination of the NMM and the compact z stage. In this case the compact z stage, with its high mechanical resonance frequency (greater than 20 kHz), is responsible for the rapid motion while the NMM simultaneously makes slower movements over a larger motion range. To reduce the Abbe offset to a minimum the SFM tip is located at the intersection of three interferometer measurement beams orientated in x, y, and z directions. To improve real time performance two high-end digital signal processing (DSP) systems are used for NMM positioning and SFM servocontrol. Comprehensive DSP firmware and Windows XP-based software are implemented, providing a flexible and user-friendly interface. The instrument is able to perform large area imaging or profile scanning directly without stitching small scanned images. Several measurements on different samples such as flatness standards, nanostep height standards, roughness standards as well as sharp nanoedge samples and 1D gratings demonstrate the outstanding metrological capabilities of the instrument

  4. Shallow surface depth profiling with atomic resolution

    Xi, J.; Dastoor, P.C.; King, B.V.; O'Connor, D.J.

    1999-01-01

    It is possible to derive atomic layer-by-layer composition depth profiles from popular electron spectroscopic techniques, such as X-ray photoelectron spectroscopy (XPS) or Auger electron spectroscopy (AES). When ion sputtering assisted AES or XPS is used, the changes that occur during the establishment of the steady state in the sputtering process make these techniques increasingly inaccurate for depths less than 3nm. Therefore non-destructive techniques of angle-resolved XPS (ARXPS) or AES (ARAES) have to be used in this case. In this paper several data processing algorithms have been used to extract the atomic resolved depth profiles of a shallow surface (down to 1nm) from ARXPS and ARAES data

  5. Future metrology needs for FEL reflective optics

    Assoufid, L.

    2000-01-01

    An International Workshop on Metrology for X-ray and Neutron Optics has been held March 16-17, 2000, at the Advanced Photon Source, Argonne National Laboratory, near Chicago, Illinois (USA). The workshop gathered engineers and scientists from both the U.S. and around the world to evaluate metrology instrumentation and methods used to characterize surface figure and finish for long grazing incidence optics used in beamlines at synchrotrons radiation sources. This two-day workshop was motivated by the rapid evolution in the performance of x-ray and neutron sources along with requirements in optics figure and finish. More specifically, the performance of future light sources, such as free-electron laser (FEL)-based x-ray sources, is being pushed to new limits in term of both brilliance and coherence. As a consequence, tolerances on surface figure and finish of the next generation of optics are expected to become tighter. The timing of the workshop provided an excellent opportunity to study the problem, evaluate the state of the art in metrology instrumentation, and stimulate innovation on future metrology instruments and techniques to be used to characterize these optics. This paper focuses on FEL optics and metrology needs. (A more comprehensive summary of the workshop can be found elsewhere.) The performance and limitations of current metrology instrumentation will be discussed and recommendations from the workshop on future metrology development to meet the FEL challenges will be detailed

  6. Future metrology needs for FEL reflective optics.

    Assoufid, L.

    2000-09-21

    An International Workshop on Metrology for X-ray and Neutron Optics has been held March 16-17, 2000, at the Advanced Photon Source, Argonne National Laboratory, near Chicago, Illinois (USA). The workshop gathered engineers and scientists from both the U.S. and around the world to evaluate metrology instrumentation and methods used to characterize surface figure and finish for long grazing incidence optics used in beamlines at synchrotrons radiation sources. This two-day workshop was motivated by the rapid evolution in the performance of x-ray and neutron sources along with requirements in optics figure and finish. More specifically, the performance of future light sources, such as free-electron laser (FEL)-based x-ray sources, is being pushed to new limits in term of both brilliance and coherence. As a consequence, tolerances on surface figure and finish of the next generation of optics are expected to become tighter. The timing of the workshop provided an excellent opportunity to study the problem, evaluate the state of the art in metrology instrumentation, and stimulate innovation on future metrology instruments and techniques to be used to characterize these optics. This paper focuses on FEL optics and metrology needs. (A more comprehensive summary of the workshop can be found elsewhere.) The performance and limitations of current metrology instrumentation will be discussed and recommendations from the workshop on future metrology development to meet the FEL challenges will be detailed.

  7. Dual-beam focused ion beam/electron microscopy processing and metrology of redeposition during ion-surface 3D interactions, from micromachining to self-organized picostructures.

    Moberlychan, Warren J

    2009-06-03

    Focused ion beam (FIB) tools have become a mainstay for processing and metrology of small structures. In order to expand the understanding of an ion impinging a surface (Sigmund sputtering theory) to our processing of small structures, the significance of 3D boundary conditions must be realized. We consider ion erosion for patterning/lithography, and optimize yields using the angle of incidence and chemical enhancement, but we find that the critical 3D parameters are aspect ratio and redeposition. We consider focused ion beam sputtering for micromachining small holes through membranes, but we find that the critical 3D considerations are implantation and redeposition. We consider ion beam self-assembly of nanostructures, but we find that control of the redeposition by ion and/or electron beams enables the growth of nanostructures and picostructures.

  8. Metrology of image placement

    Starikov, Alexander

    1998-01-01

    Metrology of registration, overlay and alignment offset in microlithography are discussed. Requirements and limitations are traced to the device ground rules and the definitions of edge, linewidth and centerline. Precision, accuracy, system performance and metrology in applications are discussed. The impact of image acquisition and data handling on performance is elucidated. Much attention is given to the manufacturing environment and effects of processing. General new methods of metrology error diagnostics and technology characterization are introduced and illustrated. Applications of these diagnostics to tests of tool performance, error diagnostics and culling, as well as to process integration in manufacturing are described. Realistic overlay reference materials and results of accuracy evaluations are discussed. Requirements in primary standards and alternative metrology are explained. The role and capability of SEM based overlay metrology is described, along with applications to device overlay metrology

  9. Metrology and testing

    2010-01-01

    The chapter presents the Metrology Service of Ionizing Radiation (SEMRI), the Metrology Service of Radioisotopes (SEMRA), the External Individual Monitoring Service (SEMEX), the Internal Individual Monitoring Service (SEMIN) and the associated laboratories, the analysis of environmental samples, system for management of quality from IRD and the National Program for intercomparison results of environmental samples analysis to radioisotopes determination

  10. The loaded surface profile: a new technique for the investigation of contact surfaces

    McBride, J.W.

    2006-01-01

    Contact between rough surfaces produces a complex contact profile. The contact area is usually estimated according to roughness statistics in conjunction withsurface models or by examining the surfaces before and after contact. Most of the existing literature on loaded surface profiles is theoretical or numerical in nature. This paper presents a methodology for a new system to measure the loaded surface profile, based on a non-contact 3D laser profiler. The system allows the measurement of...

  11. The prediction of BRDFs from surface profile measurements

    Church, E.L.; Takacs, P.Z.; Leonard, T.A.

    1989-01-01

    This paper discusses methods of predicting the BRDF of smooth surfaces from profile measurements of their surface finish. The conversion of optical profile data to the BRDF at the same wavelength is essentially independent of scattering models, while the conversion of mechanical measurements, and wavelength scaling in general, are model dependent. Procedures are illustrated for several surfaces, including two from the recent HeNe BRDF round robin, and results are compared with measured data. Reasonable agreement is found except for surfaces which involve significant scattering from isolated surface defects which are poorly sampled in the profile data

  12. New twist in the optical schematic of surface slope measuring long trace profiler

    Nikitin, Sergey M.; Gevorkyan, Gevork S.; McKinney, Wayne R.; Lacey, Ian; Takacs, Peter Z.; Yashchuk, Valeriy V.

    2017-09-01

    The advents of fully coherent free electron lasers and diffraction limited synchrotron storage ring sources of x-rays are catalyzing the development of new, ultra-high accuracy metrology methods. To fully exploit the potential of these sources, metrology needs to be capable of determining the figure of an optical element with sub-nanometer height accuracy. Currently, the two most prevalent slope measuring instruments used for characterization of x-ray optics are the auto-collimator based nanometer optical measuring device (NOM) and the long trace profiler (LTP) using pencil beam interferometry (PBI). These devices have been consistently improved upon by the x-ray optics metrology community, but appear to be approaching their metrological limits. Here, we revise the traditional optical schematic of the LTP. We experimentally show that, for the level of accuracy desired for metrology with state-of-the-art x-ray optics, the Dove prism in the LTP reference channel appears to be one of the major sources of instrumental error. Therefore, we suggest returning back to the original PBI LTP schematics with no Dove prism in the reference channel. In this case, the optimal scanning strategies [Yashchuk, Rev. Sci. Instrum. 80, 115101 (2009)] used to suppress the instrumental drift error have to be used to suppress a possible drift error associated with laser beam pointing instability. We experimentally and by numerical simulation demonstrate the usefulness of the suggested approach for measurements with x-ray optics with both face up and face down orientations.

  13. Metrology Measurement Capabilities

    Dr. Glen E. Gronniger

    2007-10-02

    This document contains descriptions of Federal Manufacturing & Technologies (FM&T) Metrology capabilities, traceability flow charts, and the measurement uncertainty of each measurement capability. Metrology provides NIST traceable precision measurements or equipment calibration for a wide variety of parameters, ranges, and state-of-the-art uncertainties. Metrology laboratories conform to the requirements of the Department of Energy Development and Production Manual Chapter 13.2, ANSI/ISO/IEC ANSI/ISO/IEC 17025:2005, and ANSI/NCSL Z540-1. FM&T Metrology laboratories are accredited by NVLAP for the parameters, ranges, and uncertainties listed in the specific scope of accreditation under NVLAP Lab code 200108-0. See the Internet at http://ts.nist.gov/Standards/scopes/2001080.pdf. These parameters are summarized. The Honeywell Federal Manufacturing & Technologies (FM&T) Metrology Department has developed measurement technology and calibration capability in four major fields of measurement: (1) Mechanical; (2) Environmental, Gas, Liquid; (3) Electrical (DC, AC, RF/Microwave); and (4) Optical and Radiation. Metrology Engineering provides the expertise to develop measurement capabilities for virtually any type of measurement in the fields listed above. A strong audit function has been developed to provide a means to evaluate the calibration programs of our suppliers and internal calibration organizations. Evaluation includes measurement audits and technical surveys.

  14. Evaporation rates and surface profiles on heterogeneous surfaces with mass transfer and surface reaction

    Flytzani-Stephanopoulos, M; Schmidt, L D

    1979-01-01

    Simple models incorporating surface reaction and diffusion of volatile products through a boundary layer are developed to calculate effective rates of evaporation and local surface profiles on surfaces having active and inactive regions. The coupling between surface heterogeneities with respect to a particular reaction and external mass transfer may provide a mechanism for the surface rearrangement and metal loss encountered in several catalytic systems of practical interest. Calculated transport rates for the volatilization of platinum in oxidizing environments and the rearrangement of this metal during the ammonia oxidation reaction agree well with published experimental data.

  15. Comparison of asphere measurements by tactile and optical metrological instruments

    Bergmans, R.H.; Nieuwenkamp, H.J.; Kok, G.J.P.; Blobel, G.; Nouira, H.; Küng, A.; Baas, M.; Voert, M.J.A. te; Baer, G.; Stuerwald, S.

    2015-01-01

    A comparison of topography measurements of aspherical surfaces was carried out by European metrology institutes, other research institutes and a company as part of an European metrology research project. In this paper the results of this comparison are presented. Two artefacts were circulated, a

  16. Metrology of electrical quantum

    Camon, A.

    1996-01-01

    Since 1989 the electrical metrology laboratory of TPYCEA and the low temperature physics department of ICMA have been collaborating in the development of electrical quantum metrology. ICMA has been mainly dedicated to implement the state of the art quantum standards for which its experience on cryogenics, superconductivity and low noise instrumentation was essential. On the other hand TPYCEA concentrated its efforts on the metrological aspects, in which it has great experience. The complimentary knowledge of both laboratories, as well as the advice obtained from several prestigious metrology institutes was the key to successful completion of the two projects so far developed: i) The Josephson voltage standard (1989-1991) ii) The quantum Hall resistance standard (1991-1996) This report contains a description of both projects. Even though we can consider that the two projects are finished from the instrumental and metrological point of view, there is still a strong cooperation between ICMA and TPYCEA on the improvement of these standards, as well as on their international validation

  17. Quantitative sputter profiling at surfaces and interfaces

    Kirschner, J.; Etzkorn, H.W.

    1981-01-01

    The key problem in quantitative sputter profiling, that of a sliding depth scale has been solved by combined Auger/X-ray microanalysis. By means of this technique and for the model system Ge/Si (amorphous) the following questions are treated quantitatively: shape of the sputter profiles when sputtering through an interface and origin of their asymmetry; precise location of the interface plane on the depth profile; broadening effects due to limited depth of information and their correction; origin and amount of bombardment induced broadening for different primary ions and energies; depth dependence of the broadening, and basic limits to depth resolution. Comparisons are made to recent theoretical calculations based on recoil mixing in the collision cascade and very good agreement is found

  18. A Century of Acoustic Metrology

    Rasmussen, Knud

    1998-01-01

    The development in acoustic measurement technique over the last century is reviewed with special emphasis on the metrological aspect.......The development in acoustic measurement technique over the last century is reviewed with special emphasis on the metrological aspect....

  19. Surface, segregation profile for Ni50Pd50(100)

    Christensen, Asbjørn; Ruban, Andrei; Skriver, Hans Lomholt

    1997-01-01

    A recent dynamical LEED study [G.N. Derry, C.B. McVey, P.J. Rous, Surf. Sci. 326 (1995) 59] reported an oscillatory surface segregation profile in the Ni50Pd50(100) system with the surface layer enriched by Pd. We have performed ab-initio total-energy calculations for the surface of this alloy...... system using the coherent potential approximation and obtain an oscillatory segregation profile, in agreement with experiments. We discuss the energetic origin of the oscillatory segregation profile in terms of effective cluster interactions. We include relaxation effects by means of the semi...

  20. Advances in speckle metrology and related techniques

    Kaufmann, Guillermo H

    2010-01-01

    Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the l

  1. Realizing "value-added" metrology

    Bunday, Benjamin; Lipscomb, Pete; Allgair, John; Patel, Dilip; Caldwell, Mark; Solecky, Eric; Archie, Chas; Morningstar, Jennifer; Rice, Bryan J.; Singh, Bhanwar; Cain, Jason; Emami, Iraj; Banke, Bill, Jr.; Herrera, Alfredo; Ukraintsev, Vladamir; Schlessinger, Jerry; Ritchison, Jeff

    2007-03-01

    The conventional premise that metrology is a "non-value-added necessary evil" is a misleading and dangerous assertion, which must be viewed as obsolete thinking. Many metrology applications are key enablers to traditionally labeled "value-added" processing steps in lithography and etch, such that they can be considered integral parts of the processes. Various key trends in modern, state-of-the-art processing such as optical proximity correction (OPC), design for manufacturability (DFM), and advanced process control (APC) are based, at their hearts, on the assumption of fine-tuned metrology, in terms of uncertainty and accuracy. These trends are vehicles where metrology thus has large opportunities to create value through the engineering of tight and targetable process distributions. Such distributions make possible predictability in speed-sorts and in other parameters, which results in high-end product. Additionally, significant reliance has also been placed on defect metrology to predict, improve, and reduce yield variability. The necessary quality metrology is strongly influenced by not only the choice of equipment, but also the quality application of these tools in a production environment. The ultimate value added by metrology is a result of quality tools run by a quality metrology team using quality practices. This paper will explore the relationships among present and future trends and challenges in metrology, including equipment, key applications, and metrology deployment in the manufacturing flow. Of key importance are metrology personnel, with their expertise, practices, and metrics in achieving and maintaining the required level of metrology performance, including where precision, matching, and accuracy fit into these considerations. The value of metrology will be demonstrated to have shifted to "key enabler of large revenues," debunking the out-of-date premise that metrology is "non-value-added." Examples used will be from critical dimension (CD

  2. Radiation protection - quality and metrology

    Broutin, J.P.

    2002-01-01

    The radiation protection gathers three occupations: radiation protection agents; environment agents ( control and monitoring); metrology agents ( activities measurement and calibration). The quality and the metrology constitute a contribution in the technique competence and the guarantee of the service quality. This article, after a historical aspect of quality and metrology in France explains the advantages of such a policy. (N.C.)

  3. Improving OCD time to solution using Signal Response Metrology

    Fang, Fang; Zhang, Xiaoxiao; Vaid, Alok; Pandev, Stilian; Sanko, Dimitry; Ramanathan, Vidya; Venkataraman, Kartik; Haupt, Ronny

    2016-03-01

    In recent technology nodes, advanced process and novel integration scheme have challenged the precision limits of conventional metrology; with critical dimensions (CD) of device reduce to sub-nanometer region. Optical metrology has proved its capability to precisely detect intricate details on the complex structures, however, conventional RCWA-based (rigorous coupled wave analysis) scatterometry has the limitations of long time-to-results and lack of flexibility to adapt to wide process variations. Signal Response Metrology (SRM) is a new metrology technique targeted to alleviate the consumption of engineering and computation resources by eliminating geometric/dispersion modeling and spectral simulation from the workflow. This is achieved by directly correlating the spectra acquired from a set of wafers with known process variations encoded. In SPIE 2015, we presented the results of SRM application in lithography metrology and control [1], accomplished the mission of setting up a new measurement recipe of focus/dose monitoring in hours. This work will demonstrate our recent field exploration of SRM implementation in 20nm technology and beyond, including focus metrology for scanner control; post etch geometric profile measurement, and actual device profile metrology.

  4. Characterization of the intrinsic density profiles for liquid surfaces

    Chacon, Enrique; Tarazona, Pedro

    2005-01-01

    This paper presents recent advances in the characterization of the intrinsic structures in computer simulations of liquid surfaces. The use of operational definitions for the intrinsic surface, associated with each molecular configuration of a liquid slab, gives direct access to the intrinsic profile and to the wavevector dependent surface tension. However, the characteristics of these functions depend on the definition used for the intrinsic surface. We discuss the pathologies associated with a local Gibbs dividing surface definition, and consider the alternative definition of a minimal area surface, going though a set of surface pivots, self-consistently chosen to represent the first liquid layer

  5. IT Security Standards and Legal Metrology - Transfer and Validation

    Thiel, F.; Hartmann, V.; Grottker, U.; Richter, D.

    2014-08-01

    Legal Metrology's requirements can be transferred into the IT security domain applying a generic set of standardized rules provided by the Common Criteria (ISO/IEC 15408). We will outline the transfer and cross validation of such an approach. As an example serves the integration of Legal Metrology's requirements into a recently developed Common Criteria based Protection Profile for a Smart Meter Gateway designed under the leadership of the Germany's Federal Office for Information Security. The requirements on utility meters laid down in the Measuring Instruments Directive (MID) are incorporated. A verification approach to check for meeting Legal Metrology's requirements by their interpretation through Common Criteria's generic requirements is also presented.

  6. Metrology Department - DEMET

    1989-01-01

    In this report are presented the activities and purposes of the Metrology Dept. of the Institute of Radioprotection and Dosimetry of Brazilian CNEN. It is also presented a list of services rendered by that Dept., the projects in course, personnel and publications.(J.A.M.M.)

  7. Metrology for Grayscale Lithography

    Murali, Raghunath

    2007-01-01

    Three dimensional microstructures find applications in diffractive optical elements, photonic elements, etc. and can be efficiently fabricated by grayscale lithography. Good process control is important for achieving the desired structures. Metrology methods for grayscale lithography are discussed. Process optimization for grayscale e-beam lithography is explored and various process parameters that affect the grayscale process are discussed

  8. Magnetic nanoparticles. Metrological aspects

    Nikiforov, V N; Nikiforov, A V; Oxengendler, B L; Turaeva, N N; Sredin, V G

    2011-01-01

    The experiments on influence of the iron oxide cluster size on the specific magnetic moment are performed. Both free and covered clusters are investigated. The experiments are interpreted on the base of core-shell model by analogy to Weizsaecker formula in the nuclear physics. Metrological parameters for the cluster size investigation are obtained.

  9. A Study on Water Surface Profiles of Rivers with Constriction

    Qian, Chaochao; Yamada, Tadashi

    2013-04-01

    Water surface profile of rivers with constrictions is precious in both classic hydraulics and river management practice. This study was conducted to clarify the essences of the water surface profiles. 3 cases of experiments and 1D numerical calculations with different discharges were made in the study and analysis solutions of the non-linear basic equation of surface profile in varied flow without considering friction were derived. The manning's number was kept in the same in each case by using crosspiece roughness. We found a new type of water surface profile of varied flow from the results of 1D numerical calculation and that of experiments and named it as Mc curve because of its mild condition with constriction segment. This kind of curves appears as a nature phenomenon ubiquitously. The process of water surface forming is dynamic and bore occurs at the upper side of constriction during increasing discharge before the surface profile formed. As a theoretical work, 3 analysis solutions were derived included 2 physical-meaning solutions in the study by using Man-Machine system. One of the derived physical-meaning solutions was confirmed that it is validity by comparing to the results of 1D numerical calculation and that of experiments. The solution represents a flow profile from under critical condition at the upper side to super critical condition at the down side of constriction segment. The other derived physical-meaning solution represents a flow profile from super critical condition at the upper side to under critical condition at the down side of constriction segment. These two kinds of flow profiles exist in the nature but no theoretical solution can express the phenomenon. We find the depth distribution only concerned with unit width discharge distribution and critical depth under a constant discharge from the derived solutions. Therefor, the profile can be gained simply and precisely by using the theoretical solutions instead of numerical calculation even

  10. Flux surface shape and current profile optimization in tokamaks

    Dobrott, D.R.; Miller, R.L.

    1977-01-01

    Axisymmetric tokamak equilibria of noncircular cross section are analyzed numerically to study the effects of flux surface shape and current profile on ideal and resistive interchange stability. Various current profiles are examined for circles, ellipses, dees, and doublets. A numerical code separately analyzes stability in the neighborhood of the magnetic axis and in the remainder of the plasma using the criteria of Mercier and Glasser, Greene, and Johnson. Results are interpreted in terms of flux surface averaged quantities such as magnetic well, shear, and the spatial variation in the magnetic field energy density over the cross section. The maximum stable β is found to vary significantly with shape and current profile. For current profiles varying linearly with poloidal flux, the highest β's found were for doublets. Finally, an algorithm is presented which optimizes the current profile for circles and dees by making the plasma everywhere marginally stable

  11. Optimized Estimation of Surface Layer Characteristics from Profiling Measurements

    Doreene Kang

    2016-01-01

    Full Text Available New sampling techniques such as tethered-balloon-based measurements or small unmanned aerial vehicles are capable of providing multiple profiles of the Marine Atmospheric Surface Layer (MASL in a short time period. It is desirable to obtain surface fluxes from these measurements, especially when direct flux measurements are difficult to obtain. The profiling data is different from the traditional mean profiles obtained at two or more fixed levels in the surface layer from which surface fluxes of momentum, sensible heat, and latent heat are derived based on Monin-Obukhov Similarity Theory (MOST. This research develops an improved method to derive surface fluxes and the corresponding MASL mean profiles of wind, temperature, and humidity with a least-squares optimization method using the profiling measurements. This approach allows the use of all available independent data. We use a weighted cost function based on the framework of MOST with the cost being optimized using a quasi-Newton method. This approach was applied to seven sets of data collected from the Monterey Bay. The derived fluxes and mean profiles show reasonable results. An empirical bias analysis is conducted using 1000 synthetic datasets to evaluate the robustness of the method.

  12. Ion induced optical emission for surface and depth profile analysis

    White, C.W.

    1977-01-01

    Low-energy ion bombardment of solid surfaces results in the emission of infrared, visible, and ultraviolet radiation produced by inelastic ion-solid collision processes. The emitted optical radiation provides important insight into low-energy particle-solid interactions and provides the basis for an analysis technique which can be used for surface and depth profile analysis with high sensitivity. The different kinds of collision induced optical radiation emitted as a result of low-energy particle-solid collisions are reviewed. Line radiation arising from excited states of sputtered atoms or molecules is shown to provide the basis for surface and depth profile analysis. The spectral characteristics of this type of radiation are discussed and applications of the ion induced optical emission technique are presented. These applications include measurements of ion implant profiles, detection sensitivities for submonolayer quantities of impurities on elemental surfaces, and the detection of elemental impurities on complex organic substrates

  13. UPWIND Metrology, Deliverable D 1A2.1, List of measurement Parameters

    Hansen, Kurt Schaldemose

    performance measurements - Improvement of aerodynamic codes - Assessment of wind resources In general terms the uncertainty of the testing techniques and methods are typically much higher than the need. Since this problem covers many areas of wind energy, the work package is de-fined as a crosscutting...... activity. The problem is especially relevant for the following areas: Production related - Power performance testing especially in wind farms - Testing of turbine improvements in the order of several percent - Testing of aerodynamic codes - Testing of turbine response to effects such as turbulence...... profiles, turbulence, surface shear recovery distances etc) - Measurements of the interaction wind farms and microclimate The objectives of the metrology work package are to develop metrology tools in wind energy to significantly enhance the quality of measurement and testing techniques. The development...

  14. Optical metrology for advanced process control: full module metrology solutions

    Bozdog, Cornel; Turovets, Igor

    2016-03-01

    Optical metrology is the workhorse metrology in manufacturing and key enabler to patterning process control. Recent advances in device architecture are gradually shifting the need for process control from the lithography module to other patterning processes (etch, trim, clean, LER/LWR treatments, etc..). Complex multi-patterning integration solutions, where the final pattern is the result of multiple process steps require a step-by-step holistic process control and a uniformly accurate holistic metrology solution for pattern transfer for the entire module. For effective process control, more process "knobs" are needed, and a tighter integration of metrology with process architecture.

  15. In-cell overlay metrology by using optical metrology tool

    Lee, Honggoo; Han, Sangjun; Hong, Minhyung; Kim, Seungyoung; Lee, Jieun; Lee, DongYoung; Oh, Eungryong; Choi, Ahlin; Park, Hyowon; Liang, Waley; Choi, DongSub; Kim, Nakyoon; Lee, Jeongpyo; Pandev, Stilian; Jeon, Sanghuck; Robinson, John C.

    2018-03-01

    Overlay is one of the most critical process control steps of semiconductor manufacturing technology. A typical advanced scheme includes an overlay feedback loop based on after litho optical imaging overlay metrology on scribeline targets. The after litho control loop typically involves high frequency sampling: every lot or nearly every lot. An after etch overlay metrology step is often included, at a lower sampling frequency, in order to characterize and compensate for bias. The after etch metrology step often involves CD-SEM metrology, in this case in-cell and ondevice. This work explores an alternative approach using spectroscopic ellipsometry (SE) metrology and a machine learning analysis technique. Advanced 1x nm DRAM wafers were prepared, including both nominal (POR) wafers with mean overlay offsets, as well as DOE wafers with intentional across wafer overlay modulation. After litho metrology was measured using optical imaging metrology, as well as after etch metrology using both SE and CD-SEM for comparison. We investigate 2 types of machine learning techniques with SE data: model-less and model-based, showing excellent performance for after etch in-cell on-device overlay metrology.

  16. Optical surface profiling of orb-web spider capture silks

    Kane, D M; Joyce, A M; Staib, G R [Department of Physics, Macquarie University, Sydney, NSW 2109 (Australia); Herberstein, M E, E-mail: deb.kane@mq.edu.a [Department of Biological Sciences, Macquarie University, Sydney, NSW 2109 (Australia)

    2010-09-15

    Much spider silk research to date has focused on its mechanical properties. However, the webs of many orb-web spiders have evolved for over 136 million years to evade visual detection by insect prey. It is therefore a photonic device in addition to being a mechanical device. Herein we use optical surface profiling of capture silks from the webs of adult female St Andrews cross spiders (Argiope keyserlingi) to successfully measure the geometry of adhesive silk droplets and to show a bowing in the aqueous layer on the spider capture silk between adhesive droplets. Optical surface profiling shows geometric features of the capture silk that have not been previously measured and contributes to understanding the links between the physical form and biological function. The research also demonstrates non-standard use of an optical surface profiler to measure the maximum width of a transparent micro-sized droplet (microlens).

  17. Optical surface profiling of orb-web spider capture silks

    Kane, D M; Joyce, A M; Staib, G R; Herberstein, M E

    2010-01-01

    Much spider silk research to date has focused on its mechanical properties. However, the webs of many orb-web spiders have evolved for over 136 million years to evade visual detection by insect prey. It is therefore a photonic device in addition to being a mechanical device. Herein we use optical surface profiling of capture silks from the webs of adult female St Andrews cross spiders (Argiope keyserlingi) to successfully measure the geometry of adhesive silk droplets and to show a bowing in the aqueous layer on the spider capture silk between adhesive droplets. Optical surface profiling shows geometric features of the capture silk that have not been previously measured and contributes to understanding the links between the physical form and biological function. The research also demonstrates non-standard use of an optical surface profiler to measure the maximum width of a transparent micro-sized droplet (microlens).

  18. Simple laser vision sensor calibration for surface profiling applications

    Abu-Nabah, Bassam A.; ElSoussi, Adnane O.; Al Alami, Abed ElRahman K.

    2016-09-01

    Due to the relatively large structures in the Oil and Gas industry, original equipment manufacturers (OEMs) have been implementing custom-designed laser vision sensor (LVS) surface profiling systems as part of quality control in their manufacturing processes. The rough manufacturing environment and the continuous movement and misalignment of these custom-designed tools adversely affect the accuracy of laser-based vision surface profiling applications. Accordingly, Oil and Gas businesses have been raising the demand from the OEMs to implement practical and robust LVS calibration techniques prior to running any visual inspections. This effort introduces an LVS calibration technique representing a simplified version of two known calibration techniques, which are commonly implemented to obtain a calibrated LVS system for surface profiling applications. Both calibration techniques are implemented virtually and experimentally to scan simulated and three-dimensional (3D) printed features of known profiles, respectively. Scanned data is transformed from the camera frame to points in the world coordinate system and compared with the input profiles to validate the introduced calibration technique capability against the more complex approach and preliminarily assess the measurement technique for weld profiling applications. Moreover, the sensitivity to stand-off distances is analyzed to illustrate the practicality of the presented technique.

  19. Flow profiling of a surface-acoustic-wave nanopump

    Guttenberg, Z.; Rathgeber, A.; Keller, S.; Rädler, J. O.; Wixforth, A.; Kostur, M.; Schindler, M.; Talkner, P.

    2004-11-01

    The flow profile in a capillary gap and the pumping efficiency of an acoustic micropump employing surface acoustic waves is investigated both experimentally and theoretically. Ultrasonic surface waves on a piezoelectric substrate strongly couple to a thin liquid layer and generate a quadrupolar streaming pattern within the fluid. We use fluorescence correlation spectroscopy and fluorescence microscopy as complementary tools to investigate the resulting flow profile. The velocity was found to depend on the applied power approximately linearly and to decrease with the inverse third power of the distance from the ultrasound generator on the chip. The found properties reveal acoustic streaming as a promising tool for the controlled agitation during microarray hybridization.

  20. Surface activity, lipid profiles and their implications in cervical cancer.

    Preetha A

    2005-01-01

    Full Text Available Background: The profiles of lipids in normal and cancerous tissues may differ revealing information about cancer development and progression. Lipids being surface active, changes in lipid profiles can manifest as altered surface activity profiles. Langmuir monolayers offer a convenient model for evaluating surface activity of biological membranes. Aims: The aims of this study were to quantify phospholipids and their effects on surface activity of normal and cancerous human cervical tissues as well as to evaluate the role of phosphatidylcholine (PC and sphingomyelin (SM in cervical cancer using Langmuir monolayers. Methods and Materials: Lipid quantification was done using thin layer chromatography and phosphorus assay. Surface activity was evaluated using Langmuir monolayers. Monolayers were formed on the surface of deionized water by spreading tissue organic phase corresponding to 1 mg of tissue and studying their surface pressure-area isotherms at body temperature. The PC and SM contents of cancerous human cervical tissues were higher than those of the normal human cervical tissues. Role of PC and SM were evaluated by adding varying amounts of these lipids to normal cervical pooled organic phase. Statistical analysis: Student′s t-test (p < 0.05 and one-way analysis of variance (ANOVA was used. Results: Our results reveals that the phosphatidylglycerol level in cancerous cervical tissue was nearly five folds higher than that in normal cervical tissue. Also PC and sphingomyelin SM were found to be the major phospholipid components in cancerous and normal cervical tissues respectively. The addition of either 1.5 µg DPPC or 0.5 µg SM /mg of tissue to the normal organic phase changed its surface activity profile to that of the cancerous tissues. Statistically significant surface activity parameters showed that PC and SM have remarkable roles in shifting the normal cervical lipophilic surface activity towards that of cancerous lipophilic

  1. Flow profiling of a surface acoustic wave nanopump

    Guttenberg, Z.; Rathgeber, A.; Keller, S.; Rädler, J. O.; Wixforth, A.; Kostur, M.; Schindler, M.; Talkner, P.

    2004-01-01

    The flow profile in a capillary gap and the pumping efficiency of an acoustic micropump employing Surface Acoustic Waves is investigated both experimentally and theoretically. Such ultrasonic surface waves on a piezoelectric substrate strongly couple to a thin liquid layer and generate an internal streaming within the fluid. Such acoustic streaming can be used for controlled agitation during, e.g., microarray hybridization. We use fluorescence correlation spectroscopy and fluorescence microsc...

  2. Optimization for sinusoidal profiles in surface relief gratings ...

    2014-02-07

    Feb 7, 2014 ... filometry [7–9] and monitoring of surface self-diffusion of solids under ultrahigh vacuum conditions [10]. In the present work, recording parameters, i.e. exposure time and deve- lopment time for fabrication of such holographic gratings have been optimized to obtain nearly perfect sinusoidal profiles in the ...

  3. Reducing Surface Clutter in Cloud Profiling Radar Data

    Tanelli, Simone; Pak, Kyung; Durden, Stephen; Im, Eastwood

    2008-01-01

    An algorithm has been devised to reduce ground clutter in the data products of the CloudSat Cloud Profiling Radar (CPR), which is a nadir-looking radar instrument, in orbit around the Earth, that measures power backscattered by clouds as a function of distance from the instrument. Ground clutter contaminates the CPR data in the lowest 1 km of the atmospheric profile, heretofore making it impossible to use CPR data to satisfy the scientific interest in studying clouds and light rainfall at low altitude. The algorithm is based partly on the fact that the CloudSat orbit is such that the geodetic altitude of the CPR varies continuously over a range of approximately 25 km. As the geodetic altitude changes, the radar timing parameters are changed at intervals defined by flight software in order to keep the troposphere inside a data-collection time window. However, within each interval, the surface of the Earth continuously "scans through" (that is, it moves across) a few range bins of the data time window. For each radar profile, only few samples [one for every range-bin increment ((Delta)r = 240 m)] of the surface-clutter signature are available around the range bin in which the peak of surface return is observed, but samples in consecutive radar profiles are offset slightly (by amounts much less than (Delta)r) with respect to each other according to the relative change in geodetic altitude. As a consequence, in a case in which the surface area under examination is homogenous (e.g., an ocean surface), a sequence of consecutive radar profiles of the surface in that area contains samples of the surface response with range resolution (Delta)p much finer than the range-bin increment ((Delta)p 10 dB and a reduction of the contaminated altitude over ocean from about 1 km to about 0.5 km (over the ocean). The algorithm has been embedded in CloudSat L1B processing as of Release 04 (July 2007), and the estimated flat surface clutter is removed in L2B-GEOPROF product from the

  4. Computed tomography for dimensional metrology

    Kruth, J.P.; Bartscher, M.; Carmignato, S.

    2011-01-01

    metrology, putting emphasis on issues as accuracy, traceability to the unit of length (the meter) and measurement uncertainty. It provides a state of the art (anno 2011) and application examples, showing the aptitude of CT metrology to: (i) check internal dimensions that cannot be measured using traditional...

  5. Metrology's role in quality assurance

    Zeederberg, L.B.

    1982-01-01

    Metrology, the science of measurement, is playing an increasing role in modern industry as part of an on-going quality assurance programme. At Escom, quality assurance was critical during the construction of the Koeberg nuclear facility, and also a function in controlling services provided by Escom. This article deals with the role metrology plays in quality assurance

  6. Metrology for ITER Assembly

    Bogusch, E.

    2006-01-01

    The overall dimensions of the ITER Tokamak and the particular assembly sequence preclude the use of conventional optical metrology, mechanical jigs and traditional dimensional control equipment, as used for the assembly of smaller, previous generation, fusion devices. This paper describes the state of the art of the capabilities of available metrology systems, with reference to the previous experience in Fusion engineering and in other industries. Two complementary procedures of transferring datum from the primary datum network on the bioshield to the secondary datum s inside the VV with the desired accuracy of about 0.1 mm is described, one method using the access directly through the ports and the other using transfer techniques, developed during the co-operation with ITER/EFDA. Another important task described is the development of a method for the rapid and easy measurement of the gaps between sectors, required for the production of the customised splice plates between them. The scope of the paper includes the evaluation of the composition and cost of the systems and team of technical staff required to meet the requirements of the assembly procedure. The results from a practical, full-scale demonstration of the methodologies used, using the proposed equipment, is described. This work has demonstrated the feasibility of achieving the necessary accuracies for the successful building of ITER. (author)

  7. Surface characterization protocol for precision aspheric optics

    Sarepaka, RamaGopal V.; Sakthibalan, Siva; Doodala, Somaiah; Panwar, Rakesh S.; Kotaria, Rajendra

    2017-10-01

    In Advanced Optical Instrumentation, Aspherics provide an effective performance alternative. The aspheric fabrication and surface metrology, followed by aspheric design are complementary iterative processes for Precision Aspheric development. As in fabrication, a holistic approach of aspheric surface characterization is adopted to evaluate actual surface error and to aim at the deliverance of aspheric optics with desired surface quality. Precision optical surfaces are characterized by profilometry or by interferometry. Aspheric profiles are characterized by contact profilometers, through linear surface scans to analyze their Form, Figure and Finish errors. One must ensure that, the surface characterization procedure does not add to the resident profile errors (generated during the aspheric surface fabrication). This presentation examines the errors introduced post-surface generation and during profilometry of aspheric profiles. This effort is to identify sources of errors and is to optimize the metrology process. The sources of error during profilometry may be due to: profilometer settings, work-piece placement on the profilometer stage, selection of zenith/nadir points of aspheric profiles, metrology protocols, clear aperture - diameter analysis, computational limitations of the profiler and the software issues etc. At OPTICA, a PGI 1200 FTS contact profilometer (Taylor-Hobson make) is used for this study. Precision Optics of various profiles are studied, with due attention to possible sources of errors during characterization, with multi-directional scan approach for uniformity and repeatability of error estimation. This study provides an insight of aspheric surface characterization and helps in optimal aspheric surface production methodology.

  8. NEW CONCEPTS AND TEST METHODS OF CURVE PROFILE AREA DENSITY IN SURFACE: ESTIMATION OF AREAL DENSITY ON CURVED SPATIAL SURFACE

    Hong Shen

    2011-01-01

    The concepts of curve profile, curve intercept, curve intercept density, curve profile area density, intersection density in containing intersection (or intersection density relied on intersection reference), curve profile intersection density in surface (or curve intercept intersection density relied on intersection of containing curve), and curve profile area density in surface (AS) were defined. AS expressed the amount of curve profile area of Y phase in the unit containing surface area, S...

  9. Fatty acid methyl ester profiles of bat wing surface lipids.

    Pannkuk, Evan L; Fuller, Nathan W; Moore, Patrick R; Gilmore, David F; Savary, Brett J; Risch, Thomas S

    2014-11-01

    Sebocytes are specialized epithelial cells that rupture to secrete sebaceous lipids (sebum) across the mammalian integument. Sebum protects the integument from UV radiation, and maintains host microbial communities among other functions. Native glandular sebum is composed primarily of triacylglycerides (TAG) and wax esters (WE). Upon secretion (mature sebum), these lipids combine with minor cellular membrane components comprising total surface lipids. TAG and WE are further cleaved to smaller molecules through oxidation or host enzymatic digestion, resulting in a complex mixture of glycerolipids (e.g., TAG), sterols, unesterified fatty acids (FFA), WE, cholesteryl esters, and squalene comprising surface lipid. We are interested if fatty acid methyl ester (FAME) profiling of bat surface lipid could predict species specificity to the cutaneous fungal disease, white nose syndrome (WNS). We collected sebaceous secretions from 13 bat spp. using Sebutape(®) and converted them to FAME with an acid catalyzed transesterification. We found that Sebutape(®) adhesive patches removed ~6× more total lipid than Sebutape(®) indicator strips. Juvenile eastern red bats (Lasiurus borealis) had significantly higher 18:1 than adults, but 14:0, 16:1, and 20:0 were higher in adults. FAME profiles among several bat species were similar. We concluded that bat surface lipid FAME profiling does not provide a robust model predicting species susceptibility to WNS. However, these results provide baseline data that can be used for lipid roles in future ecological studies, such as life history, diet, or migration.

  10. Gloss evaluation from soft and hard metrologies.

    Wang, Zihao; Xu, Lihao; Hu, Yu; Mirjalili, Fereshteh; Luo, Ming Ronnier

    2017-09-01

    Recent advances in bidirectional reflectance distribution function (BRDF) acquisitions have provided a novel approach for appearance measurement and analysis. In particular, since gloss appearance is dependent on the directional reflective properties of surfaces, it is reasonable to leverage the BRDF for gloss evaluation. In this paper, we investigate gloss appearance from both soft metrology and hard metrology. A psychophysical experiment was conducted for the gloss assessment of 47 neutral-color samples. In the evaluation of gloss perception from gloss meter measurements, we report several ambiguous correspondences in the medium gloss range. In order to analyze and explain this phenomenon, the BRDF was acquired and examined using a commercial BRDF measuring device. With an improved correlation-to-visual perception, we propose a two-dimensional gloss model by combining a parameter, the standard deviation of the specular lobe, from Ward's BRDF model with measured gloss values.

  11. Integration of mask and silicon metrology in DFM

    Matsuoka, Ryoichi; Mito, Hiroaki; Sugiyama, Akiyuki; Toyoda, Yasutaka

    2009-03-01

    We have developed a highly integrated method of mask and silicon metrology. The method adopts a metrology management system based on DBM (Design Based Metrology). This is the high accurate contouring created by an edge detection algorithm used in mask CD-SEM and silicon CD-SEM. We have inspected the high accuracy, stability and reproducibility in the experiments of integration. The accuracy is comparable with that of the mask and silicon CD-SEM metrology. In this report, we introduce the experimental results and the application. As shrinkage of design rule for semiconductor device advances, OPC (Optical Proximity Correction) goes aggressively dense in RET (Resolution Enhancement Technology). However, from the view point of DFM (Design for Manufacturability), the cost of data process for advanced MDP (Mask Data Preparation) and mask producing is a problem. Such trade-off between RET and mask producing is a big issue in semiconductor market especially in mask business. Seeing silicon device production process, information sharing is not completely organized between design section and production section. Design data created with OPC and MDP should be linked to process control on production. But design data and process control data are optimized independently. Thus, we provided a solution of DFM: advanced integration of mask metrology and silicon metrology. The system we propose here is composed of followings. 1) Design based recipe creation: Specify patterns on the design data for metrology. This step is fully automated since they are interfaced with hot spot coordinate information detected by various verification methods. 2) Design based image acquisition: Acquire the images of mask and silicon automatically by a recipe based on the pattern design of CD-SEM.It is a robust automated step because a wide range of design data is used for the image acquisition. 3) Contour profiling and GDS data generation: An image profiling process is applied to the acquired image based

  12. Surface influence upon vertical profiles in the nocturnal boundary layer

    Garratt, J. R.

    1983-05-01

    Near-surface wind profiles in the nocturnal boundary layer, depth h, above relatively flat, tree-covered terrain are described in the context of the analysis of Garratt (1980) for the unstable atmospheric boundary layer. The observations at two sites imply a surface-based transition layer, of depth z *, within which the observed non-dimensional profiles Φ M 0 are a modified form of the inertial sub-layer relation Φ _M ( {{z L}} = ( {{{1 + 5_Z } L}} ) according to Φ _M^{{0}} ˜eq ( {{{1 + 5z} L}} )exp [ { - 0.7( {{{1 - z} z}_ * } )] , where z is height above the zero-plane displacement and L is the Monin-Obukhov length. At both sites the depth z * is significantly smaller than the appropriate neutral value ( z * N ) found from the previous analysis, as might be expected in the presence of a buoyant sink for turbulent kinetic energy.

  13. Color and appearance metrology facility

    Federal Laboratory Consortium — The NIST Physical Measurement Laboratory has established the color and appearance metrology facility to support calibration services for 0°/45° colored samples, 20°,...

  14. A Roadmap for Thermal Metrology

    Bojkovski, J.; Fischer, J.; Machin, G.; Pavese, F.; Peruzzi, A.; Renaot, E.; Tegeler, E.

    2009-02-01

    A provisional roadmap for thermal metrology was developed in Spring 2006 as part of the EUROMET iMERA activity toward increasing impact from national investment in European metrology R&D. This consisted of two parts: one addressing the influence of thermal metrology on society, industry, and science, and the other specifying the requirements of enabling thermal metrology to serve future needs. The roadmap represents the shared vision of the EUROMET TC Therm committee as to how thermal metrology should develop to meet future requirements over the next 15 years. It is important to stress that these documents are a first attempt to roadmap the whole of thermal metrology and will certainly need regular review and revision to remain relevant and useful to the community they seek to serve. The first part of the roadmap, “Thermal metrology for society, industry, and science,” identifies the main social and economic triggers driving developments in thermal metrology—notably citizen safety and security, new production technologies, environment and global climate change, energy, and health. Stemming from these triggers, key targets are identified that require improved thermal measurements. The second part of the roadmap, “Enabling thermal metrology to serve future needs” identifies another set of triggers, like global trade and interoperability, future needs in transport, and the earth radiation budget. Stemming from these triggers, key targets are identified, such as improved realizations and dissemination of the SI unit the kelvin, anchoring the kelvin to the Boltzmann constant, k B, and calculating thermal properties from first principles. To facilitate these outcomes, the roadmap identifies the technical advances required in thermal measurement standards.

  15. Three-lambda metrology

    Pfoertner, Andreas; Schwider, Johannes

    2002-06-01

    The state-of-the-art technique for measuring discontinuous surface profiles, e.g. diffractive optical elements (DOE) is white-light interferometry. Compared to single wavelength phase-shifting interferometry conventional white-light-interferometry is rather slow, because the number of frames to be evaluated is about ten times greater than in phase-shifting-interferometry. Therefore white-light-interferometry needs more memory capacity and computer time. Single wavelength phase-shifting interferometry cannot be used for the mentioned task since the order of the interference fringes cannot be determined. But if three wavelengths, e.g. a red, a green, and a blue one are used which preferably have no common factor it is possible to determine the interference order of the fringes or the absolute optical path difference (OPD) of the interferometer. The interference patterns are simultaneously recorded by a color CCD-camera having 3 separate chips. The OPD is calculated for each pixel from the three phase values mod 2π . The algorithms used and experimental results will be presented.

  16. Enhanced resolution and accuracy of freeform metrology through Subaperture Stitching Interferometry

    Supranowitz, Chris; Maloney, Chris; Murphy, Paul; Dumas, Paul

    2017-10-01

    Recent advances in polishing and metrology have addressed many of the challenges in the fabrication and metrology of freeform surfaces, and the manufacture of these surfaces is possible today. However, achieving the form and mid-spatial frequency (MSF) specifications that are typical of visible imaging systems remains a challenge. Interferometric metrology for freeform surfaces is thus highly desirable for such applications, but the capability is currently quite limited for freeforms. In this paper, we provide preliminary results that demonstrate accurate, high-resolution measurements of freeform surfaces using prototype software on QED's ASI™ (Aspheric Stitching Interferometer).

  17. Economic benefits of metrology in manufacturing

    Savio, Enrico; De Chiffre, Leonardo; Carmignato, S.

    2016-01-01

    examples from industrial production, in which the added value of metrology in manufacturing is discussed and quantified. Case studies include: general manufacturing, forging, machining, and related metrology. The focus of the paper is on the improved effectiveness of metrology when used at product...... and process design stages, as well as on the improved accuracy and efficiency of manufacturing through better measuring equipment and process chains with integrated metrology for process control.......In streamlined manufacturing systems, the added value of inspection activities is often questioned, and metrology in particular is sometimes considered only as an avoidable expense. Documented quantification of economic benefits of metrology is generally not available. This work presents concrete...

  18. Surface alignment of liquid crystal multilayers evaporated on a photoaligned polyimide film observed by surface profiler

    Oo, T.N.; Iwata, T.; Kimura, M.; Akahane, T.

    2005-01-01

    The investigation of the surface alignment of liquid crystal (LC) multilayers evaporated on a photoaligned polyimide vertical alignment (PI-VA) film was carried out by means of a novel three-dimensional (3-D) surface profiler. The photoinduced anisotropy of the partially UV-exposed PI-VA film can be visualized as a topological image of LC multilayers. It seems that the topology of LC multilayers is indicating the orientational distribution of LC molecules on the treated film. Moreover, it was shown that the surface profiler can be used to produce non-contact images with high vertical resolution (∼ 0.01 nm). Copyright (2003) AD-TECH - International Foundation for the Advancement of Technology Ltd

  19. High quality-factor quartz tuning fork glass probe used in tapping mode atomic force microscopy for surface profile measurement

    Chen, Yuan-Liu; Xu, Yanhao; Shimizu, Yuki; Matsukuma, Hiraku; Gao, Wei

    2018-06-01

    This paper presents a high quality-factor (Q-factor) quartz tuning fork (QTF) with a glass probe attached, used in frequency modulation tapping mode atomic force microscopy (AFM) for the surface profile metrology of micro and nanostructures. Unlike conventionally used QTFs, which have tungsten or platinum probes for tapping mode AFM, and suffer from a low Q-factor influenced by the relatively large mass of the probe, the glass probe, which has a lower density, increases the Q-factor of the QTF probe unit allowing it to obtain better measurement sensitivity. In addition, the process of attaching the probe to the QTF with epoxy resin, which is necessary for tapping mode AFM, is also optimized to further improve the Q-factor of the QTF glass probe. The Q-factor of the optimized QTF glass probe unit is demonstrated to be very close to that of a bare QTF without a probe attached. To verify the effectiveness and the advantages of the optimized QTF glass probe unit, the probe unit is integrated into a home-built tapping mode AFM for conducting surface profile measurements of micro and nanostructures. A blazed grating with fine tool marks of 100 nm, a microprism sheet with a vertical amplitude of 25 µm and a Fresnel lens with a steep slope of 90 degrees are used as measurement specimens. From the measurement results, it is demonstrated that the optimized QTF glass probe unit can achieve higher sensitivity as well as better stability than conventional probes in the measurement of micro and nanostructures.

  20. Frequency Standards and Metrology

    Maleki, Lute

    2009-04-01

    Preface / Lute Maleki -- Symposium history / Jacques Vanier -- Symposium photos -- pt. I. Fundamental physics. Variation of fundamental constants from the big bang to atomic clocks: theory and observations (Invited) / V. V. Flambaum and J. C. Berengut. Alpha-dot or not: comparison of two single atom optical clocks (Invited) / T. Rosenband ... [et al.]. Variation of the fine-structure constant and laser cooling of atomic dysprosium (Invited) / N. A. Leefer ... [et al.]. Measurement of short range forces using cold atoms (Invited) / F. Pereira Dos Santos ... [et al.]. Atom interferometry experiments in fundamental physics (Invited) / S. W. Chiow ... [et al.]. Space science applications of frequency standards and metrology (Invited) / M. Tinto -- pt. II. Frequency & metrology. Quantum metrology with lattice-confined ultracold Sr atoms (Invited) / A. D. Ludlow ... [et al.]. LNE-SYRTE clock ensemble: new [symbol]Rb hyperfine frequency measurement - spectroscopy of [symbol]Hg optical clock transition (Invited) / M. Petersen ... [et al.]. Precise measurements of S-wave scattering phase shifts with a juggling atomic clock (Invited) / S. Gensemer ... [et al.]. Absolute frequency measurement of the [symbol] clock transition (Invited) / M. Chwalla ... [et al.]. The semiclassical stochastic-field/atom interaction problem (Invited) / J. Camparo. Phase and frequency noise metrology (Invited) / E. Rubiola ... [et al.]. Optical spectroscopy of atomic hydrogen for an improved determination of the Rydberg constant / J. L. Flowers ... [et al.] -- pt. III. Clock applications in space. Recent progress on the ACES mission (Invited) / L. Cacciapuoti and C. Salomon. The SAGAS mission (Invited) / P. Wolf. Small mercury microwave ion clock for navigation and radioScience (Invited) / J. D. Prestage ... [et al.]. Astro-comb: revolutionizing precision spectroscopy in astrophysics (Invited) / C. E. Kramer ... [et al.]. High frequency very long baseline interferometry: frequency standards and

  1. Metrology of reflection optics for synchrotron radiation

    Takacs, P.Z.

    1985-09-01

    Recent years have seen an almost explosive growth in the number of beam lines on new and existing synchrotron radiation facilities throughout the world. The need for optical components to utilize the unique characteristics of synchrotron radiation has increased accordingly. Unfortunately, the technology to manufacture and measure the large, smooth, exotic optical surfaces required to focus and steer the synchrotron radiation beam has not progressed as rapidly as the operational demands on these components. Most companies do not wish to become involved with a project that requires producing a single, very expensive, aspheric optic with surface roughness and figure tolerances that are beyond their capabilities to measure. This paper will review some of the experiences of the National Synchrotron Light Source in procuring grazing incidence optical components over the past several years. We will review the specification process - how it is related to the function of the optic, and how it relates to the metrology available during the manufacturing process and after delivery to the user's laboratory. We will also discuss practical aspects of our experience with new technologies, such as single point diamond turning of metal mirrors and the use of SiC as a mirror material. Recent advances in metrology instrumentation have the potential to move the measurement of surface figure and finish from the research laboratory into the optical shop, which should stimulate growth and interest in the manufacturing of optics to meet the needs of the synchrotron radiation user community

  2. Critical issues in overlay metrology

    Sullivan, Neal T.

    2001-01-01

    In this paper, following an overview of overlay metrology, the difficult relationship of overlay with device performance and yield is discussed and supported with several examples. This is followed by a discussion of the impending collision of metrology equipment performance and 'real' process tolerances for sub 0.18 um technologies. This convergence of tolerance and performance is demonstrated to lead to the current emergence of real-time overlay modeling in a feed-forward/feedback process environment and the associated metrology/sampling implications. This modeling takes advantage of the wealth of understanding concerning the systematic behavior of overlay registration errors. Finally, the impact of new process technologies (RET, OAI, CPSM, CMP, and etc.) on the measurement target is discussed and shown to de-stabilize overlay performance on standard overlay measurement target designs

  3. Dimensional micro and nano metrology

    Hansen, Hans Nørgaard; da Costa Carneiro, Kim; Haitjema, Han

    2006-01-01

    The need for dimensional micro and nano metrology is evident, and as critical dimensions are scaled down and geometrical complexity of objects is increased, the available technologies appear not sufficient. Major research and development efforts have to be undertaken in order to answer these chal......The need for dimensional micro and nano metrology is evident, and as critical dimensions are scaled down and geometrical complexity of objects is increased, the available technologies appear not sufficient. Major research and development efforts have to be undertaken in order to answer...... these challenges. The developments have to include new measuring principles and instrumentation, tolerancing rules and procedures as well as traceability and calibration. The current paper describes issues and challenges in dimensional micro and nano metrology by reviewing typical measurement tasks and available...

  4. SURFACE BRIGHTNESS PROFILES OF DWARF GALAXIES. II. COLOR TRENDS AND MASS PROFILES

    Herrmann, Kimberly A. [Penn State Mont Alto, 1 Campus Drive, Mont Alto, PA 17237 (United States); Hunter, Deidre A. [Lowell Observatory, 1400 West Mars Hill Road, Flagstaff, AZ 86001 (United States); Elmegreen, Bruce G., E-mail: kah259@psu.edu, E-mail: dah@lowell.edu, E-mail: bge@us.ibm.com [IBM T. J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, NY 10598 (United States)

    2016-06-01

    In this second paper of a series, we explore the B  −  V , U  −  B , and FUV−NUV radial color trends from a multi-wavelength sample of 141 dwarf disk galaxies. Like spirals, dwarf galaxies have three types of radial surface brightness profiles: (I) single exponential throughout the observed extent (the minority), (II) down-bending (the majority), and (III) up-bending. We find that the colors of (1) Type I dwarfs generally become redder with increasing radius, unlike spirals which have a blueing trend that flattens beyond ∼1.5 disk scale lengths, (2) Type II dwarfs come in six different “flavors,” one of which mimics the “U” shape of spirals, and (3) Type III dwarfs have a stretched “S” shape where the central colors are flattish, become steeply redder toward the surface brightness break, then remain roughly constant beyond, which is similar to spiral Type III color profiles, but without the central outward bluing. Faint (−9 >  M{sub B}  > −14) Type II dwarfs tend to have continuously red or “U” shaped colors and steeper color slopes than bright (−14 >  M{sub B}  > −19) Type II dwarfs, which additionally have colors that become bluer or remain constant with increasing radius. Sm dwarfs and BCDs tend to have at least some blue and red radial color trend, respectively. Additionally, we determine stellar surface mass density (Σ) profiles and use them to show that the break in Σ generally remains in Type II dwarfs (unlike Type II spirals) but generally disappears in Type III dwarfs (unlike Type III spirals). Moreover, the break in Σ is strong, intermediate, and weak in faint dwarfs, bright dwarfs, and spirals, respectively, indicating that Σ may straighten with increasing galaxy mass. Finally, the average stellar surface mass density at the surface brightness break is roughly 1−2  M {sub ⊙} pc{sup −2} for Type II dwarfs but higher at 5.9  M {sub ⊙} pc{sup −2} or 27  M {sub ⊙} pc{sup −2} for

  5. Metrological Reliability of Medical Devices

    Costa Monteiro, E.; Leon, L. F.

    2015-02-01

    The prominent development of health technologies of the 20th century triggered demands for metrological reliability of physiological measurements comprising physical, chemical and biological quantities, essential to ensure accurate and comparable results of clinical measurements. In the present work, aspects concerning metrological reliability in premarket and postmarket assessments of medical devices are discussed, pointing out challenges to be overcome. In addition, considering the social relevance of the biomeasurements results, Biometrological Principles to be pursued by research and innovation aimed at biomedical applications are proposed, along with the analysis of their contributions to guarantee the innovative health technologies compliance with the main ethical pillars of Bioethics.

  6. Celtiberian metrology and its romanization

    Leonard A. CURCHIN

    2013-05-01

    Full Text Available Celtiberian metrology has scarcely been investigated until now, with the exception of coin weights. On the basis of measurements of pre-Roman mud bricks, a Celtiberian foot of 24 cm is proposed. With regard to weights, we can accept a module of 9 g for silver jewelry and some bronze coins; however, loom weights do not conform to any metrological system. Over time, Roman measures of length (as indicated by the dimensions of bricks, tiles and architectural monuments and weight were adopted.

  7. Metrological issues in molecular radiotherapy

    D'Arienzo, Marco; Capogni, Marco; Smyth, Vere; Cox, Maurice; Johansson, Lena; Bobin, Christophe

    2014-01-01

    The therapeutic effect from molecular radiation therapy (MRT), on both tumour and normal tissue, is determined by the radiation absorbed dose. Recent research indicates that as a consequence of biological variation across patients the absorbed dose can vary, for the same administered activity, by as much as two orders of magnitude. The international collaborative EURAMET-EMRP project Metrology for molecular radiotherapy (MetroMRT) is addressing this problem. The overall aim of the project is to develop methods of calibrating and verifying clinical dosimetry in MRT. In the present paper an overview of the metrological issues in molecular radiotherapy is provided. (authors)

  8. Metrology/viewing system for next generation fusion reactors

    Spampinato, P.T.; Barry, R.E.; Chesser, J.B.; Menon, M.M.; Dagher, M.A.

    1997-01-01

    Next generation fusion reactors require accurate measuring systems to verify sub-millimeter alignment of plasma-facing components in the reactor vessel. A metrology system capable of achieving such accuracy must be compatible with the vessel environment of high gamma radiation, high vacuum, elevated temperature, and magnetic field. This environment requires that the system must be remotely deployed. A coherent, frequency modulated laser radar system is being integrated with a remotely operated deployment system to meet these requirements. The metrology/viewing system consists of a compact laser transceiver optics module which is linked through fiber optics to the laser source and imaging units that are located outside of the harsh environment. The deployment mechanism is a telescopic-mast positioning system. This paper identifies the requirements for the International Thermonuclear Experimental Reactor metrology and viewing system, and describes a remotely operated precision ranging and surface mapping system

  9. Neutron metrology in the HFR

    Kraakman, R.; Voorbraak, W.P.

    1993-04-01

    Additional to the in-core EXOTIC experiments, six irradiations of ceramic material, R212-001 to R212-006, have been performed in the PSF of the HFR. This note presents the neutron metrology results for these irradiations. (orig.)

  10. Profile Curvature Derivative Surface used to characterize the complexity of the seafloor around St. John, USVI

    National Oceanic and Atmospheric Administration, Department of Commerce — Profile curvature was calculated from the bathymetry surface for each raster cell using the ArcGIS 3D Analyst "Curvature" Tool. Profile curvature describes the rate...

  11. Metrology and ionospheric observation standards

    Panshin, Evgeniy; Minligareev, Vladimir; Pronin, Anton

    Accuracy and ionospheric observation validity are urgent trends nowadays. WMO, URSI and national metrological and standardisation services bring forward requirements and descriptions of the ionospheric observation means. Researches in the sphere of metrological and standardisation observation moved to the next level in the Russian Federation. Fedorov Institute of Applied Geophysics (IAG) is in charge of ionospheric observation in the Russian Federation and the National Technical Committee, TC-101 , which was set up on the base of IAG- of the standardisation in the sphere. TC-101 can be the platform for initiation of the core international committee in the network of ISO The new type of the ionosounde “Parus-A” is engineered, which is up to the national requirements. “Parus-A” calibration and test were conducted by National metrological Institute (NMI) -D.I. Mendeleyev Institute for Metrology (VNIIM), signed CIMP MRA in 1991. VNIIM is a basic NMI in the sphere of Space weather (including ionospheric observations), the founder of which was celebrated chemist and metrologist Dmitriy I. Mendeleyev. Tests and calibration were carried out for the 1st time throughout 50-year-history of ionosonde exploitation in Russia. The following metrological characteristics were tested: -measurement range of radiofrequency time delay 0.5-10 ms; -time measurement inaccuracy of radio- frequency pulse ±12mcs; -frequency range of radio impulse 1-20 MHz ; -measurement inaccuracy of radio impulse carrier frequency± 5KHz. For example, the sound impulse simulator that was built-in in the ionosounde was used for measurement range of radiofrequency time delay testing. The number of standards on different levels is developed. - “Ionospheric observation guidance”; - “The Earth ionosphere. Terms and definitions”.

  12. At-wavelength Optical Metrology Development at the ALS

    Yuan, Sheng Sam; Goldberg, Kenneth A.; Yashchuk, Valeriy V.; Celestre, Richard; Mochi, Iacopo; Macdougall, James; Morrison, Gregory Y.; Smith, Brian V.; Domning, Edward E.; McKinney, Wayne R.; Warwick, Tony

    2010-01-01

    Nano-focusing and brightness preservation for ever brighter synchrotron radiation and free electron laser beamlines require surface slope tolerances of x-ray optics on the order of 100 nrad. While the accuracy of fabrication and ex situ metrology of x-ray mirrors has improved over time, beamline in situ performance of the optics is often limited by application specific factors such as x-ray beam heat loading, temperature drift, alignment, vibration, etc. In the present work, we discuss the recent results from the Advanced Light Source developing high accuracy, in situ, at-wavelength wavefront measurement techniques to surpass 100-nrad accuracy surface slope measurements with reflecting x-ray optics. The techniques will ultimately allow closed-loop feedback systems to be implemented for x-ray nano-focusing. In addition, we present a dedicated metrology beamline endstation, applicable to a wide range of in situ metrology and test experiments. The design and performance of a bendable Kirkpatrick-Baez (KB) mirror with active temperature stabilization will also be presented. The mirror is currently used to study, refine, and optimize in situ mirror alignment, bending and metrology methods essential for nano-focusing application.

  13. SAQP pitch walk metrology using single target metrology

    Fang, Fang; Herrera, Pedro; Kagalwala, Taher; Camp, Janay; Vaid, Alok; Pandev, Stilian; Zach, Franz

    2017-03-01

    Self-aligned quadruple patterning (SAQP) processes have found widespread acceptance in advanced technology nodes to drive device scaling beyond the resolution limitations of immersion scanners. Of the four spaces generated in this process from one lithography pattern two tend to be equivalent as they are derived from the first spacer deposition. The three independent spaces are commonly labelled as α, β and γ. α, β and γ are controlled by multiple process steps including the initial lithographic patterning process, the two mandrel and spacer etches as well as the two spacer depositions. Scatterometry has been the preferred metrology approach, however is restricted to repetitive arrays. In these arrays independent measurements, in particular of alpha and gamma, are not possible due to degeneracy of the standard array targets. . In this work we present a single target approach which lifts the degeneracies commonly encountered while using product relevant layout geometries. We will first describe the metrology approach which includes the previously described SRM (signal response metrology) combined with reference data derived from CD SEM data. The performance of the methodology is shown in figures 1-3. In these figures the optically determined values for alpha, beta and gamma are compared to the CD SEM reference data. The variations are achieved using controlled process experiments varying Mandrel CD and Spacer deposition thicknesses.

  14. AWRE (nonconventional) metrology scene

    West, F.L.

    1978-01-01

    Progress at AWRE in the adaptation of optical interferometry to contour and thickness measurement arising with two-dimensional shell and metal mirror parts is described. The primary aim is to outline various inspection problems encountered with use of rotary contour gauges in order to illustrate reasons for the direction of development and to invite comment on proposed solutions. Surface finish of machined parts is seen as a linked problem bearing directly on determination accuracy and repeatability of measurement. A clearer understanding of surface topography and its measurement is being sought as a necessary adjunct to precision inspection of conventional parts and to guide tooling development in mirror manufacture

  15. Comparison of metrological techniques for evaluation of the impact of a cosmetic product containing hyaluronic acid on the properties of skin surface.

    Janiš, Rahula; Pata, Vladimír; Egner, Pavlína; Pavlačková, Jana; Zapletalová, Andrea; Kejlová, Kristina

    2017-06-14

    The aim of this research was to evaluate mutual interchangeability of four principally different biometric instrumental techniques designed for objective measurement of changes in the physical, mechanical, and topographical properties of the skin surface treated with commercial antiaging cosmetic products with hyaluronic acid. The following instrumental devices were used: Visioscope PC 35, Corneometer Multiprobe Adapter MPA 6, Reviscometer RVM 600, and 3D scanner Talysurf CLI 500. The comparison of the individual methods was performed using cluster analysis. The study involved 25 female volunteers aged 40-65. Measurements were taken before and after 30 daily in vivo applications of an antiaging preparation to the skin surface in the periorbital area. A slight reduction in skin surface roughness was recorded in 55% of the volunteers. On the contrary, a worsening from their initial states was detected in 25% of the subjects, while for 20%, no significant change was reported. Cluster analysis confirmed that the mentioned methodologies can be divided into two basic clusters, namely, a cluster of methods recording the changes in skin relief by means of optical techniques, and a cluster of methods investigating changes in hydration and anisotropy. In practice, the techniques in different clusters are not interchangeable and should be assessed separately.

  16. TSOM method for semiconductor metrology

    Attota, Ravikiran; Dixson, Ronald G.; Kramar, John A.; Potzick, James E.; Vladár, András E.; Bunday, Benjamin; Novak, Erik; Rudack, Andrew

    2011-03-01

    Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry, scanning electron microscopy (SEM), and atomic force microscopy (AFM). TSOM can be used in both reflection and transmission modes and is applicable to a variety of target materials and shapes. Nanometrology applications that have been demonstrated by experiments or simulations include defect analysis, inspection and process control; critical dimension, photomask, overlay, nanoparticle, thin film, and 3D interconnect metrologies; line-edge roughness measurements; and nanoscale movements of parts in MEMS/NEMS. Industries that could benefit include semiconductor, data storage, photonics, biotechnology, and nanomanufacturing. TSOM is relatively simple and inexpensive, has a high throughput, and provides nanoscale sensitivity for 3D measurements with potentially significant savings and yield improvements in manufacturing.

  17. Theoretical fringe profiles with crossed Babinet compensators in testing concave aspheric surfaces.

    Saxena, A K; Lancelot, J P

    1982-11-15

    This paper presents the theory for the use of crossed Babinet compensators in testing concave aspheric surfaces. Theoretical fringe profiles for a sphere and for an aspheric surface with primary aberration are shown. Advantages of this method are discussed.

  18. Metrology and quality control handbook

    Hofmann, D.

    1983-01-01

    This book tries to present the fundamentals of metrology and quality control in brief surveys. Compromises had to be made in order to reduce the material available to a sensible volume for the sake of clarity. This becomes evident by the following two restrictions which had to made: First, in dealing with the theoretical principles of metrology and quality control, mere reference had to be made in many cases to the great variety of special literature without discussing it to explain further details. Second, in dealing with the application of metrology and quality control techniques in practice, only the basic qantities of the International System of Units (SI) could be taken into account as a rule. Some readers will note that many special measuring methods and equipment known to them are not included in this book. I do hope, however, that this short-coming will show to have a positive effect, too. This book will show the reader how to find the basic quantities and units from the derived quantities and units, and the steps that are necessary to solve any kind of measuring task. (orig./RW) [de

  19. Metrology at Philip Morris Europe

    Gualandris R

    2014-12-01

    Full Text Available The importance of the metrology function at Philip Morris Europe (PME, a multinational organisation producing at over 40 sites in the European, Middle Eastern and African Regions is presented. Standardisation of test methods and equipment as well as the traceability of calibration gauges to the same reference gauge are essential in order to obtain comparable results among the various production centers. The metrology function as well as the qualification of instruments and the drafting of test and calibration operating procedures for this region are conducted or co-ordinated by the Research and Development Department in Neuchatel, Switzerland. In this paper the metrology function within PME is presented based on the measurement of the resistance to draw for which the PME R&D laboratory is accredited (ISO/CEI 17025, as both a calibration and a testing laboratory. The following topics are addressed in this paper: traceability of calibration standards to national standards; comparison of results among manufacturing centres; the choice, the budget as well as the computation of uncertainties. Furthermore, some practical aspects related to the calibration and use of the glass multicapillary gauges are discussed.

  20. Flexible resources for quantum metrology

    Friis, Nicolai; Orsucci, Davide; Skotiniotis, Michalis; Sekatski, Pavel; Dunjko, Vedran; Briegel, Hans J.; Dür, Wolfgang

    2017-06-01

    Quantum metrology offers a quadratic advantage over classical approaches to parameter estimation problems by utilising entanglement and nonclassicality. However, the hurdle of actually implementing the necessary quantum probe states and measurements, which vary drastically for different metrological scenarios, is usually not taken into account. We show that for a wide range of tasks in metrology, 2D cluster states (a particular family of states useful for measurement-based quantum computation) can serve as flexible resources that allow one to efficiently prepare any required state for sensing, and perform appropriate (entangled) measurements using only single qubit operations. Crucially, the overhead in the number of qubits is less than quadratic, thus preserving the quantum scaling advantage. This is ensured by using a compression to a logarithmically sized space that contains all relevant information for sensing. We specifically demonstrate how our method can be used to obtain optimal scaling for phase and frequency estimation in local estimation problems, as well as for the Bayesian equivalents with Gaussian priors of varying widths. Furthermore, we show that in the paradigmatic case of local phase estimation 1D cluster states are sufficient for optimal state preparation and measurement.

  1. Flexible resources for quantum metrology

    Friis, Nicolai; Orsucci, Davide; Skotiniotis, Michalis; Sekatski, Pavel; Dunjko, Vedran; Briegel, Hans J; Dür, Wolfgang

    2017-01-01

    Quantum metrology offers a quadratic advantage over classical approaches to parameter estimation problems by utilising entanglement and nonclassicality. However, the hurdle of actually implementing the necessary quantum probe states and measurements, which vary drastically for different metrological scenarios, is usually not taken into account. We show that for a wide range of tasks in metrology, 2D cluster states (a particular family of states useful for measurement-based quantum computation) can serve as flexible resources that allow one to efficiently prepare any required state for sensing, and perform appropriate (entangled) measurements using only single qubit operations. Crucially, the overhead in the number of qubits is less than quadratic, thus preserving the quantum scaling advantage. This is ensured by using a compression to a logarithmically sized space that contains all relevant information for sensing. We specifically demonstrate how our method can be used to obtain optimal scaling for phase and frequency estimation in local estimation problems, as well as for the Bayesian equivalents with Gaussian priors of varying widths. Furthermore, we show that in the paradigmatic case of local phase estimation 1D cluster states are sufficient for optimal state preparation and measurement. (paper)

  2. MEASURING PROTOPLANETARY DISK GAS SURFACE DENSITY PROFILES WITH ALMA

    Williams, Jonathan P.; McPartland, Conor, E-mail: jpw@ifa.hawaii.edu [Institute for Astronomy, University of Hawaii at Manoa, Honolulu, HI 96822 (United States)

    2016-10-10

    The gas and dust are spatially segregated in protoplanetary disks due to the vertical settling and radial drift of large grains. A fuller accounting of the mass content and distribution in disks therefore requires spectral line observations. We extend the modeling approach presented in Williams and Best to show that gas surface density profiles can be measured from high fidelity {sup 13}CO integrated intensity images. We demonstrate the methodology by fitting ALMA observations of the HD 163296 disk to determine a gas mass, M {sub gas} = 0.048 M {sub ⊙}, and accretion disk characteristic size R {sub c} = 213 au and gradient γ = 0.39. The same parameters match the C{sup 18}O 2–1 image and indicate an abundance ratio [{sup 12}CO]/[C{sup 18}O] of 700 independent of radius. To test how well this methodology can be applied to future line surveys of smaller, lower mass T Tauri disks, we create a large {sup 13}CO 2–1 image library and fit simulated data. For disks with gas masses 3–10 M {sub Jup} at 150 pc, ALMA observations with a resolution of 0.″2–0.″3 and integration times of ∼20 minutes allow reliable estimates of R {sub c} to within about 10 au and γ to within about 0.2. Economic gas imaging surveys are therefore feasible and offer the opportunity to open up a new dimension for studying disk structure and its evolution toward planet formation.

  3. Improving Metrological Reliability of Information-Measuring Systems Using Mathematical Modeling of Their Metrological Characteristics

    Kurnosov, R. Yu; Chernyshova, T. I.; Chernyshov, V. N.

    2018-05-01

    The algorithms for improving the metrological reliability of analogue blocks of measuring channels and information-measuring systems are developed. The proposed algorithms ensure the optimum values of their metrological reliability indices for a given analogue circuit block solution.

  4. Development of an ultrasensitive interferometry system as a key to precision metrology applications

    Gohlke, Martin; Schuldt, Thilo; Weise, Dennis; Johann, Ulrich; Peters, Achim; Braxmaier, Claus

    2009-06-01

    We present a symmetric heterodyne interferometer as a prototype of a highly sensitive translation and tilt measurement system. This compact optical metrology system was developed over the past several years by EADS Astrium (Friedrichshafen) in cooperation with the Humboldt-University (Berlin) and the university of applied science Konstanz (HTWG-Konstanz). The noise performance was tested at frequencies between 10-4 and 3 Hz, the noise levels are below 1 nm/Hz 1/2 for translation and below 1 μrad/Hz1/2, for tilt measurements. For frequencies higher than 10 mHz noise levels below 5pm/Hz1/2 and 4 nrad/Hz1/2 respectively, were demonstrated. Based on this highly sensitive metrology system we also developed a dilatometer for the characterization of the CTE (coefficient of thermal expansion) of various materials, i.e. CFRP (carbon fiber reinforced plastic) or Zerodur. The currently achieved sensitivity of these measurements is better than 10-7 K-1. Future planned applications of the interferometer include ultra-high-precision surface profiling and characterization of actuator noise in low-noise opto-mechanics setups. We will give an overview of the current experimental setup and the latest measurement results.

  5. Optical metrology tools for the Virgo projet

    Loriette, V.

    is a description of the various optical components that have to be manufactured and tested for Virgo. The next sections are dedicated to the description of various metrology instruments. In chapter 2 we focus on absorption of light in multilayer coatings. The sensitivity of interferometric detectors is degraded by this loss process, not only because it decreases the laser beam power, but also and chiefly because thermo-elastic deformations and changes of the indexes of refraction modify the beam profile. Optical coatings have now reached an absorption level lower than at m. We present a method based on the mirage effect, i.e. the deflexion of light by an index of refraction gradient induced by non homogeneous heating. This “mirage bench” has a sensitivity better than 10^{-8}. We start by a discussion of the approximations that are useful to simplify the problem, we then derive the equation that give the signal amplitude versus the absorption factor. Afterwards we describe the instrument and give a few results with home made Virgo mirrors as well as commercial samples. In the following chapter we discuss the problem of measuring reflexion factors. We focus on two particular problems, the first one is common, it is to measure high (higher than 0.9999) reflexion factors by the use of Fabry-Perot cavities. We present various possible schemes and we detail a particular one which seems to be the easiest to implement. We use a pulsed laser source and measure the average reflexion factor of the two Fabry-Perot mirrors by studying the pulse shape modification after transmission by the cavity. We estimate the sensitivity of this intrument to 10^{-6}. The second problem is a less common one and is to evaluate the relative homogeneity of reflexion factors on large components. Because inhomogeneities of this parameter will degrade the sensitivity of Virgo by coupling various modes of the laser beam with the fundamental one, homogeneity higher than 1{-}10^{-4} is required. We

  6. A new approach to stitching optical metrology data

    King, Christopher W.

    The next generation of optical instruments, including telescopes and imaging apparatus, will generate an increased requirement for larger and more complex optical forms. A major limiting factor for the production of such optical components is the metrology: how do we measure such parts and with respect to what reference datum This metrology can be thought of as part of a complete cycle in the production of optical components and it is currently the most challenging aspect of production. This thesis investigates a new and complete approach to stitching optical metrology data to extend the effective aperture or, in future, the dynamic range of optical metrology instruments. A practical approach is used to build up a complete process for stitching on piano and spherical parts. The work forms a basis upon which a stitching system for aspheres might be developed in the future, which is inherently more complicated. Beginning with a historical perspective and a review of optical polishing and metrology, the work presented relates the commercially available metrology instruments to the stitching process developed. The stitching is then performed by a numerical optimization routine that seeks to join together overlapping sub-aperture measurements by consideration of the aberrations introduced by the measurement scenario, and by the overlap areas between measurements. The stitching is part of a larger project, the PPARC Optical Manipulation and Metrology project, and was to benefit from new wavefront sensing technology developed by a project partner, and to be used for the sub-aperture measurement. Difficult mathematical problems meant that such a wavefront sensor was not avail able for this work and a work-around was therefore developed using commercial instruments. The techniques developed can be adapted to work on commercial ma chine platforms, and in partuicular, the OMAM NPL/UCL swing-arm profilometer described in chapter 5, or the computer controlled polishing machines

  7. Tools intented to nuclear metrology

    Munayco Tasayco, A.F.

    1980-08-01

    The study undertaken in the metrological laboratory of the C.E.N. Saclay Electronics Services is intended to improve the measurement methods in two fields concerning nuclear instrumentation: the current's measurement in the range 1pA to 0,01 pA and the study of a measurement's system for the linear circuits used in spectrometer gamma ray with semiconductor. Two systems are now working. Its permit an improvement of precision measurement, an automation of the measurement process and many possibilities in the choice of parameters and the laying-out of results [fr

  8. Primary calibration in acoustics metrology

    Milhomem, T A Bacelar; Soares, Z M Defilippo

    2015-01-01

    SI unit in acoustics is realized by the reciprocity calibrations of laboratory standard microphones in pressure field, free field and diffuse field. Calibrations in pressure field and in free field are already consolidated and the Inmetro already done them. Calibration in diffuse field is not yet consolidated, however, some national metrology institutes, including Inmetro, are conducting researches on this subject. This paper presents the reciprocity calibration, the results of Inmetro in recent key comparisons and the research that is being developed for the implementation of reciprocity calibration in diffuse field

  9. Temperature profiles on the gadolinium surface during electron beam evaporation

    Ohba, Hironori; Shibata, Takemasa [Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

    1995-03-01

    The distributions of surface temperature of gadolinium in a water-cooled copper crucible during electron beam evaporation were measured by optical pyrometry. The surface temperatures were obtained from the radiation intensity ratio of the evaporating surface and a reference light source using Planck`s law of radiation. The emitted radiation from the evaporating surface and a reference source was detected by a CCD sensor through a band pass filter of 650 nm. The measured surface temperature generally agreed with those estimated from the deposition rate and the data of the saturated vapor pressure. At high input powers, it was found that the measured value had small difference with the estimated one due to variation of the surface condition. (author).

  10. Temperature profiles on the gadolinium surface during electron beam evaporation

    Ohba, Hironori; Shibata, Takemasa

    1995-01-01

    The distributions of surface temperature of gadolinium in a water-cooled copper crucible during electron beam evaporation were measured by optical pyrometry. The surface temperatures were obtained from the radiation intensity ratio of the evaporating surface and a reference light source using Planck's law of radiation. The emitted radiation from the evaporating surface and a reference source was detected by a CCD sensor through a band pass filter of 650 nm. The measured surface temperature generally agreed with those estimated from the deposition rate and the data of the saturated vapor pressure. At high input powers, it was found that the measured value had small difference with the estimated one due to variation of the surface condition. (author)

  11. Opportunities and Risks in Semiconductor Metrology

    Borden, Peter

    2005-09-01

    New metrology opportunities are constantly emerging as the semiconductor industry attempts to meet scaling requirements. The paper summarizes some of the key FEOL and BEOL needs. These must be weighed against a number of considerations to ensure that they are good opportunities for the metrology equipment supplier. The paper discusses some of these considerations.

  12. Laboratorio de Metrología - LABM

    Jaramillo Ch., Zaira J.

    2011-01-01

    esos y transacciones de forma transparente y justa para todas las partes involucradas. Una herramienta necesaria para este propósito es la Metrología, ciencia que es utilizada en el Laboratorio de Metrología (LABM) del Centro Experimenta

  13. Anisotropic characterization of rock fracture surfaces subjected to profile analysis

    Zhou, H.W.; Xie, H.

    2004-01-01

    The mechanical parameters of a rock fracture are dependent on its surface roughness anisotropy. In this Letter, we show how quantitatively describe the anisotropy of a rock fracture surface. A parameter, referred to as the index for the accumulation power spectral density psd*, is proposed to characterize the anisotropy of a rock fracture surface. Variation of psd*, with orientation angle θ of sampling, is also discussed

  14. Fractal Metrology for biogeosystems analysis

    V. Torres-Argüelles

    2010-11-01

    Full Text Available The solid-pore distribution pattern plays an important role in soil functioning being related with the main physical, chemical and biological multiscale and multitemporal processes of this complex system. In the present research, we studied the aggregation process as self-organizing and operating near a critical point. The structural pattern is extracted from the digital images of three soils (Chernozem, Solonetz and "Chocolate" Clay and compared in terms of roughness of the gray-intensity distribution quantified by several measurement techniques. Special attention was paid to the uncertainty of each of them measured in terms of standard deviation. Some of the applied methods are known as classical in the fractal context (box-counting, rescaling-range and wavelets analyses, etc. while the others have been recently developed by our Group. The combination of these techniques, coming from Fractal Geometry, Metrology, Informatics, Probability Theory and Statistics is termed in this paper Fractal Metrology (FM. We show the usefulness of FM for complex systems analysis through a case study of the soil's physical and chemical degradation applying the selected toolbox to describe and compare the structural attributes of three porous media with contrasting structure but similar clay mineralogy dominated by montmorillonites.

  15. 100 Years of radionuclide metrology

    Judge, S.M.; Arnold, D.; Chauvenet, B.; Collé, R.; De Felice, P.; García-Toraño, E.; Wätjen, U.

    2014-01-01

    The discipline of radionuclide metrology at national standards institutes started in 1913 with the certification by Curie, Rutherford and Meyer of the first primary standards of radium. In early years, radium was a valuable commodity and the aim of the standards was largely to facilitate trade. The focus later changed to providing standards for the new wide range of radionuclides, so that radioactivity could be used for healthcare and industrial applications while minimising the risk to patients, workers and the environment. National measurement institutes responded to the changing demands by developing new techniques for realising primary standards of radioactivity. Looking ahead, there are likely to be demands for standards for new radionuclides used in nuclear medicine, an expansion of the scope of the field into quantitative imaging to facilitate accurate patient dosimetry for nuclear medicine, and an increasing need for accurate standards for radioactive waste management and nuclear forensics. - Highlights: • The driving forces for the development of radionuclide metrology. • Radium standards to facilitate trade of this valuable commodity in the early years. • After 1950, focus changes to healthcare and industrial applications. • National Measurement Institutes develop new techniques, standards, and disseminate the best practice in measurement. • Challenges in nuclear medicine, radioactive waste management and nuclear forensics

  16. How well Can We Classify SWOT-derived Water Surface Profiles?

    Frasson, R. P. M.; Wei, R.; Picamilh, C.; Durand, M. T.

    2015-12-01

    The upcoming Surface Water Ocean Topography (SWOT) mission will detect water bodies and measure water surface elevation throughout the globe. Within its continental high resolution mask, SWOT is expected to deliver measurements of river width, water elevation and slope of rivers wider than ~50 m. The definition of river reaches is an integral step of the computation of discharge based on SWOT's observables. As poorly defined reaches can negatively affect the accuracy of discharge estimations, we seek strategies to break up rivers into physically meaningful sections. In the present work, we investigate how accurately we can classify water surface profiles based on simulated SWOT observations. We assume that most river sections can be classified as either M1 (mild slope, with depth larger than the normal depth), or A1 (adverse slope with depth larger than the critical depth). This assumption allows the classification to be based solely on the second derivative of water surface profiles, with convex profiles being classified as A1 and concave profiles as M1. We consider a HEC-RAS model of the Sacramento River as a representation of the true state of the river. We employ the SWOT instrument simulator to generate a synthetic pass of the river, which includes our best estimates of height measurement noise and geolocation errors. We process the resulting point cloud of water surface heights with the RiverObs package, which delineates the river center line and draws the water surface profile. Next, we identify inflection points in the water surface profile and classify the sections between the inflection points. Finally, we compare our limited classification of simulated SWOT-derived water surface profile to the "exact" classification of the modeled Sacramento River. With this exercise, we expect to determine if SWOT observations can be used to find inflection points in water surface profiles, which would bring knowledge of flow regimes into the definition of river reaches.

  17. Metrological characterization methods for confocal chromatic line sensors and optical topography sensors

    Seppä, Jeremias; Niemelä, Karri; Lassila, Antti

    2018-05-01

    The increasing use of chromatic confocal technology for, e.g. fast, in-line optical topography, and measuring thickness, roughness and profiles implies a need for the characterization of various aspects of the sensors. Single-point, line and matrix versions of chromatic confocal technology, encoding depth information into wavelength, have been developed. Of these, line sensors are particularly suitable for in-line process measurement. Metrological characterization and development of practical methods for calibration and checking is needed for new optical methods and devices. Compared to, e.g. tactile methods, optical topography measurement techniques have limitations related to light wavelength and coherence, optical properties of the sample including reflectivity, specularity, roughness and colour, and definition of optical versus mechanical surfaces. In this work, metrological characterization methods for optical line sensors were developed for scale magnification and linearity, sensitivity to sample properties, and dynamic characteristics. An accurate depth scale calibration method using a single prototype groove depth sample was developed for a line sensor and validated with laser-interferometric sample tracking, attaining (sub)micrometre level or better than 0.1% scale accuracy. Furthermore, the effect of different surfaces and materials on the measurement and depth scale was studied, in particular slope angle, specularity and colour. In addition, dynamic performance, noise, lateral scale and resolution were measured using the developed methods. In the case of the LCI1200 sensor used in this study, which has a 11.3 mm  ×  2.8 mm measurement range, the instrument depth scale was found to depend only minimally on sample colour, whereas measuring steeply sloped specular surfaces in the peripheral measurement area, in the worst case, caused a somewhat larger relative sample-dependent change (1%) in scale.

  18. The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profiles

    Carter, G.; Katardjiev, I.V.; Nobes, M.J.

    1989-01-01

    The quasi-linear partial differential continuity equations that describe the evolution of the depth profiles and surface concentrations of marker atoms in kinematically equivalent systems undergoing sputtering, ion collection and atomic mixing are solved using the method of characteristics. It is shown how atomic mixing probabilities can be deduced from measurements of ion collection depth profiles with increasing ion fluence, and how this information can be used to predict surface concentration evolution. Even with this information, however, it is shown that it is not possible to deconvolute directly the surface concentration measurements to provide initial depth profiles, except when only ion collection and sputtering from the surface layer alone occur. It is demonstrated further that optimal recovery of initial concentration depth profiles could be ensured if the concentration-measuring analytical probe preferentially sampled depths near and at the maximum depth of bombardment-induced perturbations. (author)

  19. Comparison of two methods of surface profile extraction from multiple ultrasonic range measurements

    Barshan, B; Baskent, D

    Two novel methods for surface profile extraction based on multiple ultrasonic range measurements are described and compared. One of the methods employs morphological processing techniques, whereas the other employs a spatial voting scheme followed by simple thresholding. Morphological processing

  20. The way we measure: comparison of methods to derive radial surface brightness profiles

    Peters, S. P. C.; van der Kruit, P. C.; de Jong, R. S.

    The breaks and truncations in the luminosity profile of face-on spiral galaxies offer valuable insights in their formation history. The traditional method of deriving the surface photometry profile for face-on galaxies is to use elliptical averaging. In this paper, we explore the question whether

  1. The outer disks of early-type galaxies. I. Surface-brightness profiles of barred galaxies

    Erwin, Peter; Pohlen, Michael; Beckman, John E.

    We present a study of 66 barred, early-type (S0-Sb) disk galaxies, focused on the disk surface brightness profile outside the bar region, with the aim of throwing light on the nature of Freeman type I and II profiles, their origins, and their possible relation to disk truncations. This paper

  2. Phase shifting white light interferometry using colour CCD for optical metrology and bio-imaging applications

    Upputuri, Paul Kumar; Pramanik, Manojit

    2018-02-01

    Phase shifting white light interferometry (PSWLI) has been widely used for optical metrology applications because of their precision, reliability, and versatility. White light interferometry using monochrome CCD makes the measurement process slow for metrology applications. WLI integrated with Red-Green-Blue (RGB) CCD camera is finding imaging applications in the fields optical metrology and bio-imaging. Wavelength dependent refractive index profiles of biological samples were computed from colour white light interferograms. In recent years, whole-filed refractive index profiles of red blood cells (RBCs), onion skin, fish cornea, etc. were measured from RGB interferograms. In this paper, we discuss the bio-imaging applications of colour CCD based white light interferometry. The approach makes the measurement faster, easier, cost-effective, and even dynamic by using single fringe analysis methods, for industrial applications.

  3. Deep learning for galaxy surface brightness profile fitting

    Tuccillo, D.; Huertas-Company, M.; Decencière, E.; Velasco-Forero, S.; Domínguez Sánchez, H.; Dimauro, P.

    2018-03-01

    Numerous ongoing and future large area surveys (e.g. Dark Energy Survey, EUCLID, Large Synoptic Survey Telescope, Wide Field Infrared Survey Telescope) will increase by several orders of magnitude the volume of data that can be exploited for galaxy morphology studies. The full potential of these surveys can be unlocked only with the development of automated, fast, and reliable analysis methods. In this paper, we present DeepLeGATo, a new method for 2-D photometric galaxy profile modelling, based on convolutional neural networks. Our code is trained and validated on analytic profiles (HST/CANDELS F160W filter) and it is able to retrieve the full set of parameters of one-component Sérsic models: total magnitude, effective radius, Sérsic index, and axis ratio. We show detailed comparisons between our code and GALFIT. On simulated data, our method is more accurate than GALFIT and ˜3000 time faster on GPU (˜50 times when running on the same CPU). On real data, DeepLeGATo trained on simulations behaves similarly to GALFIT on isolated galaxies. With a fast domain adaptation step made with the 0.1-0.8 per cent the size of the training set, our code is easily capable to reproduce the results obtained with GALFIT even on crowded regions. DeepLeGATo does not require any human intervention beyond the training step, rendering it much automated than traditional profiling methods. The development of this method for more complex models (two-component galaxies, variable point spread function, dense sky regions) could constitute a fundamental tool in the era of big data in astronomy.

  4. Bayesian estimation methods in metrology

    Cox, M.G.; Forbes, A.B.; Harris, P.M.

    2004-01-01

    In metrology -- the science of measurement -- a measurement result must be accompanied by a statement of its associated uncertainty. The degree of validity of a measurement result is determined by the validity of the uncertainty statement. In recognition of the importance of uncertainty evaluation, the International Standardization Organization in 1995 published the Guide to the Expression of Uncertainty in Measurement and the Guide has been widely adopted. The validity of uncertainty statements is tested in interlaboratory comparisons in which an artefact is measured by a number of laboratories and their measurement results compared. Since the introduction of the Mutual Recognition Arrangement, key comparisons are being undertaken to determine the degree of equivalence of laboratories for particular measurement tasks. In this paper, we discuss the possible development of the Guide to reflect Bayesian approaches and the evaluation of key comparison data using Bayesian estimation methods

  5. Metrology for Fuel Cell Manufacturing

    Stocker, Michael [National Inst. of Standards and Technology, Gaithersburg, MD (United States); Stanfield, Eric [National Inst. of Standards and Technology, Gaithersburg, MD (United States)

    2015-02-04

    The project was divided into three subprojects. The first subproject is Fuel Cell Manufacturing Variability and Its Impact on Performance. The objective was to determine if flow field channel dimensional variability has an impact on fuel cell performance. The second subproject is Non-contact Sensor Evaluation for Bipolar Plate Manufacturing Process Control and Smart Assembly of Fuel Cell Stacks. The objective was to enable cost reduction in the manufacture of fuel cell plates by providing a rapid non-contact measurement system for in-line process control. The third subproject is Optical Scatterfield Metrology for Online Catalyst Coating Inspection of PEM Soft Goods. The objective was to evaluate the suitability of Optical Scatterfield Microscopy as a viable measurement tool for in situ process control of catalyst coatings.

  6. Neutron metrology in the HFR

    Polle, A.N.; Voorbraak, W.P.

    1991-11-01

    The experiment R-139-416 for testing the stainless steel type 316L(N) has been irradiated in the HFR Petten. This report presents the final metrology results obtained from activation monitors near the CT-specimen (Compact Tension). Data about the helium production as well as the number of displacements per atom are also included. The irradiation conditions for this experiment, carried out in a REFA-170 type capsule in the HFR position H8, are as close as possible to the conditions of the EFR (European Fast Reactor) above-core structures. The main results of the thermal and fast neutron fluence measurements are presented in table 1 and in figure 1. (author). 10 refs.; 2 figs.; 11 tabs

  7. Metrological aspects of enzyme production

    Kerber, T M; Pereira-Meirelles, F V; Dellamora-Ortiz, G M

    2010-01-01

    Enzymes are frequently used in biotechnology to carry out specific biological reactions, either in industrial processes or for the production of bioproducts and drugs. Microbial lipases are an important group of biotechnologically valuable enzymes that present widely diversified applications. Lipase production by microorganisms is described in several published papers; however, none of them refer to metrological evaluation and the estimation of the uncertainty in measurement. Moreover, few of them refer to process optimization through experimental design. The objectives of this work were to enhance lipase production in shaken-flasks with Yarrowia lipolytica cells employing experimental design and to evaluate the uncertainty in measurement of lipase activity. The highest lipolytic activity obtained was about three- and fivefold higher than the reported activities of CRMs BCR-693 and BCR-694, respectively. Lipase production by Y. lipolytica cells aiming the classification as certified reference material is recommended after further purification and stability studies

  8. Context-based virtual metrology

    Ebersbach, Peter; Urbanowicz, Adam M.; Likhachev, Dmitriy; Hartig, Carsten; Shifrin, Michael

    2018-03-01

    Hybrid and data feed forward methodologies are well established for advanced optical process control solutions in highvolume semiconductor manufacturing. Appropriate information from previous measurements, transferred into advanced optical model(s) at following step(s), provides enhanced accuracy and exactness of the measured topographic (thicknesses, critical dimensions, etc.) and material parameters. In some cases, hybrid or feed-forward data are missed or invalid for dies or for a whole wafer. We focus on approaches of virtual metrology to re-create hybrid or feed-forward data inputs in high-volume manufacturing. We discuss missing data inputs reconstruction which is based on various interpolation and extrapolation schemes and uses information about wafer's process history. Moreover, we demonstrate data reconstruction approach based on machine learning techniques utilizing optical model and measured spectra. And finally, we investigate metrics that allow one to assess error margin of virtual data input.

  9. National Needs for Appearance Metrology

    Nadal, Maria E.

    2003-04-01

    Appearance greatly influences a customer's judgement of the quality and acceptability of manufactured products, as yearly there is approximately $700 billion worth of shipped goods for which overall appearance is critical to their sale. For example, appearance is reported to be a major factor in about half of automobile purchases. The appearance of an object is the result of a complex interaction of the light field incident upon the object, the scattering and absorption properties of the object, and human perception. The measurable attributes of appearance are divided into color (hue, saturation, and lightness) and geometry (gloss, haze). The nature of the global economy has increased international competition and the need to improve the quality of many manufactured products. Since the manufacturing and marketing of these products is international in scope, the lack of national appearance standard artifacts and measurement protocols results in a direct loss to the supplier. One of the primary missions of the National Institute of Standards and Technology (NIST) is to strengthen the U.S. economy by working with industry to develop and apply technology, measurements and standards. The NIST Physics Laboratory has established an appearance metrology laboratory. This new laboratory provides calibration services for 0^o/45^o color standards and 20^o°, 60^o°, and 85^o° specular gloss, and research in the colorimetric characterization of gonioapparent including a new Standard Reference Material for metallic coatings (SRM 2017) and measurement protocols for pearlescent coatings. These services are NIST's first appearance metrology efforts in many years; a response to needs articulated by industry. These services are designed to meet demands for improved measurements and standards to enhance the acceptability of final products since appearance often plays a major role in their acceptability.

  10. Metrology in Pharmaceutical Industry - A Case Study

    Yuvamoto, Priscila D.; Fermam, Ricardo K. S.; Nascimento, Elizabeth S.

    2016-01-01

    Metrology is recognized by improving production process, increasing the productivity, giving more reliability to the measurements and consequently, it impacts in the economy of a country. Pharmaceutical area developed GMP (Good Manufacture Practice) requeriments, with no introduction of metrological concepts. However, due to Nanomedicines, it is expected this approach and the consequent positive results. The aim of this work is to verify the level of metrology implementation in a Brazilian pharmaceutical industry, using a case study. The purpose is a better mutual comprehension by both areas, acting together and governmental support to robustness of Brazilian pharmaceutical area. (paper)

  11. Surface density profile and surface tension of the one-component classical plasma

    Ballone, P.; Senatore, G.; Trieste Univ.; Tosi, M.P.; Oxford Univ.

    1982-08-01

    The density profile and the interfacial tension of two classical plasmas in equilibrium at different densities are evaluated in the square-density-gradient approximation. For equilibrium in the absence of applied external voltage, the profile is oscillatory in the higher-density plasma and the interfacial tension is positive. The amplitude and phase of these oscillations and the magnitude of the interfacial tension are related to the width of the background profile. Approximate representations of the equilibrium profile by matching of its asymptotic forms are analyzed. A comparison with computer simulation data and a critical discussion of a local-density theory are also presented. (author)

  12. Eddy current spectroscopy for near-surface residual stress profiling in surface treated nonmagnetic engine alloys

    Abu-Nabah, Bassam A.

    Recent research results indicated that eddy current conductivity measurements can be exploited for nondestructive evaluation of near-surface residual stresses in surface-treated nickel-base superalloy components. Most of the previous experimental studies were conducted on highly peened (Almen 10-16A) specimens that exhibit harmful cold work in excess of 30% plastic strain. Such high level of cold work causes thermo-mechanical relaxation at relatively modest operational temperatures; therefore the obtained results were not directly relevant to engine manufacturers and end users. The main reason for choosing peening intensities in excess of recommended normal levels was that in low-conductivity engine alloys the eddy current penetration depth could not be forced below 0.2 mm without expanding the measurements above 10 MHz which is beyond the operational range of most commercial eddy current instruments. As for shot-peened components, it was initially felt that the residual stress effect was more difficult to separate from cold work, texture, and inhomogeneity effects in titanium alloys than in nickel-base superalloys. In addition, titanium alloys have almost 50% lower electric conductivity than nickel-base superalloys; therefore require proportionally higher inspection frequencies, which was not feasible until our recent breakthrough in instrument development. Our work has been focused on six main aspects of this continuing research, namely, (i) the development of an iterative inversion technique to better retrieve the depth-dependent conductivity profile from the measured frequency-dependent apparent eddy current conductivity (AECC), (ii) the extension of the frequency range up to 80 MHz to better capture the peak compressive residual stress in nickel-base superalloys using a new eddy current conductivity measuring system, which offers better reproducibility, accuracy and measurement speed than the previously used conventional systems, (iii) the lift-off effect on

  13. Stochastic analysis of 1D and 2D surface topography of x-ray mirrors

    Tyurina, Anastasia Y.; Tyurin, Yury N.; Yashchuk, Valeriy V.

    2017-08-01

    The design and evaluation of the expected performance of new optical systems requires sophisticated and reliable information about the surface topography for planned optical elements before they are fabricated. The problem is especially complex in the case of x-ray optics, particularly for the X-ray Surveyor under development and other missions. Modern x-ray source facilities are reliant upon the availability of optics with unprecedented quality (surface slope accuracy quality optics. The uniqueness of the optics and limited number of proficient vendors makes the fabrication extremely time consuming and expensive, mostly due to the limitations in accuracy and measurement rate of metrology used in fabrication. We discuss improvements in metrology efficiency via comprehensive statistical analysis of a compact volume of metrology data. The data is considered stochastic and a new statistical model called Invertible Time Invariant Linear Filter (InTILF) is developed now for 2D surface profiles to provide compact description of the 2D data additionally to 1D data treated so far. The model captures faint patterns in the data and serves as a quality metric and feedback to polishing processes, avoiding high resolution metrology measurements over the entire optical surface. The modeling, implemented in our Beatmark software, allows simulating metrology data for optics made by the same vendor and technology. The forecast data is vital for reliable specification for optical fabrication, to be exactly adequate for the required system performance.

  14. Surface roughness influences on the behaviour of flow inside microchannels

    Farias, M. H.; Castro, C. S.; Garcia, D. A.; Henrique, J. S.

    2018-03-01

    This work discusses influence of the surface roughness on the behavior of liquids flowing inside microchannels. By measuring the flow profile using the micro-PIV technique, the flow of water inside two rectangular microchannels of different wall roughness and in a circular smooth microchannel was studied. Comparisons were made among the experimental results, showing that a metrological approach concerning surface characteristics of microdevices is required to ensure reliability of the measurements for flow analyses in microfluidic processes.

  15. Whole genome expression profiling using DNA microarray for determining biocompatibility of polymeric surfaces

    Stangegaard, Michael; Wang, Zhenyu; Kutter, Jörg Peter

    2006-01-01

    There is an ever increasing need to find surfaces that are biocompatible for applications like medical implants and microfluidics-based cell culture systems. The biocompatibility of five different surfaces with different hydrophobicity was determined using gene expression profiling as well as more...

  16. Improving automated 3D reconstruction methods via vision metrology

    Toschi, Isabella; Nocerino, Erica; Hess, Mona; Menna, Fabio; Sargeant, Ben; MacDonald, Lindsay; Remondino, Fabio; Robson, Stuart

    2015-05-01

    This paper aims to provide a procedure for improving automated 3D reconstruction methods via vision metrology. The 3D reconstruction problem is generally addressed using two different approaches. On the one hand, vision metrology (VM) systems try to accurately derive 3D coordinates of few sparse object points for industrial measurement and inspection applications; on the other, recent dense image matching (DIM) algorithms are designed to produce dense point clouds for surface representations and analyses. This paper strives to demonstrate a step towards narrowing the gap between traditional VM and DIM approaches. Efforts are therefore intended to (i) test the metric performance of the automated photogrammetric 3D reconstruction procedure, (ii) enhance the accuracy of the final results and (iii) obtain statistical indicators of the quality achieved in the orientation step. VM tools are exploited to integrate their main functionalities (centroid measurement, photogrammetric network adjustment, precision assessment, etc.) into the pipeline of 3D dense reconstruction. Finally, geometric analyses and accuracy evaluations are performed on the raw output of the matching (i.e. the point clouds) by adopting a metrological approach. The latter is based on the use of known geometric shapes and quality parameters derived from VDI/VDE guidelines. Tests are carried out by imaging the calibrated Portable Metric Test Object, designed and built at University College London (UCL), UK. It allows assessment of the performance of the image orientation and matching procedures within a typical industrial scenario, characterised by poor texture and known 3D/2D shapes.

  17. Generating strain signals under consideration of road surface profiles

    Putra, T. E.; Abdullah, S.; Schramm, D.; Nuawi, M. Z.; Bruckmann, T.

    2015-08-01

    The current study aimed to develop the mechanism for generating strain signal utilising computer-based simulation. The strain data, caused by the acceleration, were undertaken from a fatigue data acquisition involving car movements. Using a mathematical model, the measured strain signals yielded to acceleration data used to describe the bumpiness of road surfaces. The acceleration signals were considered as an external disturbance on generating strain signals. Based on this comparison, both the actual and simulated strain data have similar pattern. The results are expected to provide new knowledge to generate a strain signal via a simulation.

  18. The quality of measurements a metrological reference

    Fridman, A E

    2012-01-01

    This book provides a detailed discussion and commentary on the fundamentals of metrology. The fundamentals of metrology, the principles underlying the design of the SI International System of units, the theory of measurement error, a new methodology for estimation of measurement accuracy based on uncertainty, and methods for reduction of measured results and estimation of measurement uncertainty are all discussed from a modern point of view. The concept of uncertainty is shown to be consistent with the classical theory of accuracy. The theory of random measurement errors is supplemented by a very general description based on the generalized normal distribution; systematic instrumental error is described in terms of a methodology for normalizing the metrological characteristics of measuring instruments. A new international system for assuring uniformity of measurements based on agreements between national metrological institutes is discussed, in addition to the role and procedure for performance of key compari...

  19. Optical metrology techniques for dimensional stability measurements

    Ellis, Jonathan David

    2010-01-01

    This thesis work is optical metrology techniques to determine material stability. In addition to displacement interferometry, topics such as periodic nonlinearity, Fabry-Perot interferometry, refractometry, and laser stabilization are covered.

  20. UPWIND 1A2 Metrology. Final Report

    Eecen, P.J.; Wagenaar, J.W.; Stefanatos, N.

    . Since this problem covers many areas of wind energy, the work package is defined as a crosscutting activity. The objectives of the metrology work package are to develop metrology tools in wind energy to significantly enhance the quality of measurement and testing techniques. The first deliverable...... is a valuable tool for the further assessment and interest has been shown from other work packages, such as Training. This report describes the activities that have been carried out in the Work Package 1A2 Metrology of the UpWind project. Activities from Risø are described in a separate report: T.F. Pedersen...... was to perform a state of the art assessment to identify all relevant measurands. The required accuracies and required sampling frequencies have been identified from the perspective of the users of the data (the other work packages in UpWind). This work led to the definition of the Metrology Database, which...

  1. Impact of the ITRS Metrology Roadmap

    Diebold, Alain C.

    2001-01-01

    The International Technology Roadmap for Semiconductors (ITRS) provides the semiconductor industry with the timing of critical technology needs for future generations of integrated circuits. The Metrology roadmap in the ITRS describes the measurement needs based on the process requirements found in the Lithography, Front End Processes, Interconnect, and Packaging Roadmaps. This paper illustrates the impact of the Metrology Roadmap on the development of key measurement technology

  2. Slovak Institute of Metrology. Annual Report 2001

    Bily, M.

    2002-03-01

    A brief account of activities carried out by the Slovak Institute of Metrology (SMU) in 2001 is presented. These activities are reported under the headings: (1) Organisation identification; (2) Mission and medium-term perspectives; (3) Contract with Slovak Office of Standards, Metrology and Testing of the Slovak Republic; (4) SMU activities ; (5) Economic results; (6) Personnel management; (7) Aims and results of their fulfilment; (8) Evaluation and analysis of SMU development in 2001; (9) Main group of outputs users; (10) Conclusion

  3. Objectives and functions of ionizing radiation metrology

    Rothe, H.

    1981-01-01

    Proceeding from the fundamental objectives of ionizing radiation metrology, the main tasks of metrological research and assurances of accurate measurements in dosimetry and activity determination are summarized. With a view to the technical performance of these tasks the state-of-the-art and the trends in reproduction and dissemination of dosimetric and activity units are outlined. Problems are derived that should be solved within the framework of the CMEA Standing Commissions on Standardization and on the Peaceful Uses of Atomic Energy. (author)

  4. NIF Target Assembly Metrology Methodology and Results

    Alger, E. T. [General Atomics, San Diego, CA (United States); Kroll, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Dzenitis, E. G. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Montesanti, R. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Hughes, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Swisher, M. [IAP, Livermore, CA (United States); Taylor, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Segraves, K. [IAP, Livermore, CA (United States); Lord, D. M. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Reynolds, J. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Castro, C. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Edwards, G. [Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

    2011-01-01

    During our inertial confinement fusion (ICF) experiments at the National Ignition Facility (NIF) we require cryogenic targets at the 1-cm scale to be fabricated, assembled, and metrologized to micron-level tolerances. During assembly of these ICF targets, there are physical dimensmetrology is completed using optical coordinate measurement machines that provide repeatable measurements with micron precision, while also allowing in-process data collection for absolute accuracy in assembly. To date, 51 targets have been assembled and metrologized, and 34 targets have been successfully fielded on NIF relying on these metrology data. In the near future, ignition experiments on NIF will require tighter tolerances and more demanding target assembly and metrology capability. Metrology methods, calculations, and uncertainty estimates will be discussed. Target diagnostic port alignment, target position, and capsule location results will be reviewed for the 2009 Energetics Campaign. The information is presented via control charts showing the effect of process improvements that were made during target production. Certain parameters, including capsule position, met the 2009 campaign specifications but will have much tighter requirements in the future. Finally, in order to meet these new requirements assembly process changes and metrology capability upgrades will be necessary.

  5. Determination of line profiles on nano-structured surfaces using EUV and x-ray scattering

    Soltwisch, Victor; Wernecke, Jan; Haase, Anton; Probst, Jürgen; Schoengen, Max; Krumrey, Michael; Scholze, Frank; Pomplun, Jan; Burger, Sven

    2014-09-01

    Non-imaging techniques like X-ray scattering are supposed to play an important role in the further development of CD metrology for the semiconductor industry. Grazing Incidence Small Angle X-ray Scattering (GISAXS) provides directly assessable information on structure roughness and long-range periodic perturbations. The disadvantage of the method is the large footprint of the X-ray beam on the sample due to the extremely shallow angle of incidence. This can be overcome by using wavelengths in the extreme ultraviolet (EUV) spectral range, EUV small angle scattering (EUVSAS), which allows for much steeper angles of incidence but preserves the range of momentum transfer that can be observed. Generally, the potentially higher momentum transfer at shorter wavelengths is counterbalanced by decreasing diffraction efficiency. This results in a practical limit of about 10 nm pitch for which it is possible to observe at least the +/- 1st diffraction orders with reasonable efficiency. At the Physikalisch-Technische Bundesanstalt (PTB), the available photon energy range extends from 50 eV up to 10 keV at two adjacent beamlines. PTB commissioned a new versatile Ellipso-Scatterometer which is capable of measuring 6" square substrates in a clean, hydrocarbon-free environment with full flexibility regarding the direction of the incident light polarization. The reconstruction of line profiles using a geometrical model with six free parameters, based on a finite element method (FEM) Maxwell solver and a particle swarm based least-squares optimization yielded consistent results for EUV-SAS and GISAXS. In this contribution we present scatterometry data for line gratings and consistent reconstruction results of the line geometry for EUV-SAS and GISAXS.

  6. Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique

    Wang, Hongchang, E-mail: hongchang.wang@diamond.ac.uk; Kashyap, Yogesh; Laundy, David; Sawhney, Kawal [Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

    2015-06-06

    The two-dimensional slope error of an X-ray mirror has been retrieved by employing the speckle scanning technique, which will be valuable at synchrotron radiation facilities and in astronomical telescopes. In situ metrology overcomes many of the limitations of existing metrology techniques and is capable of exceeding the performance of present-day optics. A novel technique for precisely characterizing an X-ray bimorph mirror and deducing its two-dimensional (2D) slope error map is presented. This technique has also been used to perform fast optimization of a bimorph mirror using the derived 2D piezo response functions. The measured focused beam size was significantly reduced after the optimization, and the slope error map was then verified by using geometrical optics to simulate the focused beam profile. This proposed technique is expected to be valuable for in situ metrology of X-ray mirrors at synchrotron radiation facilities and in astronomical telescopes.

  7. Optical vortex metrology: Are phase singularities foes or friends in optical metrology?

    Takeda, M.; Wang, W.; Hanson, Steen Grüner

    2008-01-01

    We raise an issue whether phase singularities are foes or friends in optical metrology, and give an answer by introducing the principle and applications of a new technique which we recently proposed for displacement and flow measurements. The technique is called optical vortex metrology because i...

  8. Near-surface fault detection by migrating back-scattered surface waves with and without velocity profiles

    Yu, Han

    2016-04-26

    We demonstrate that diffraction stack migration can be used to discover the distribution of near-surface faults. The methodology is based on the assumption that near-surface faults generate detectable back-scattered surface waves from impinging surface waves. We first isolate the back-scattered surface waves by muting or FK filtering, and then migrate them by diffraction migration using the surface wave velocity as the migration velocity. Instead of summing events along trial quasi-hyperbolas, surface wave migration sums events along trial quasi-linear trajectories that correspond to the moveout of back-scattered surface waves. We have also proposed a natural migration method that utilizes the intrinsic traveltime property of the direct and the back-scattered waves at faults. For the synthetic data sets and the land data collected in Aqaba, where surface wave velocity has unexpected perturbations, we migrate the back-scattered surface waves with both predicted velocity profiles and natural Green\\'s function without velocity information. Because the latter approach avoids the need for an accurate velocity model in event summation, both the prestack and stacked migration images show competitive quality. Results with both synthetic data and field records validate the feasibility of this method. We believe applying this method to global or passive seismic data can open new opportunities in unveiling tectonic features.

  9. Dimensional Metrology of Non-rigid Parts Without Specialized Inspection Fixtures =

    Sabri, Vahid

    Quality control is an important factor for manufacturing companies looking to prosper in an era of globalization, market pressures and technological advances. Functionality and product quality cannot be guaranteed without this important aspect. Manufactured parts have deviations from their nominal (CAD) shape caused by the manufacturing process. Thus, geometric inspection is a very important element in the quality control of mechanical parts. We will focus here on the geometric inspection of non-rigid (flexible) parts which are widely used in the aeronautic and automotive industries. Non-rigid parts can have different forms in a free-state condition compared with their nominal models due to residual stress and gravity loads. To solve this problem, dedicated inspection fixtures are generally used in industry to compensate for the displacement of such parts for simulating the use state in order to perform geometric inspections. These fixtures and the installation and inspection processes are expensive and time-consuming. Our aim in this thesis is therefore to develop an inspection method which eliminates the need for specialized fixtures. This is done by acquiring a point cloud from the part in a free-state condition using a contactless measuring device such as optical scanning and comparing it with the CAD model for the deviation identification. Using a non-rigid registration method and finite element analysis, we numerically inspect the profile of a non-rigid part. To do so, a simulated displacement is performed using an improved definition of displacement boundary conditions for simulating unfixed parts. In addition, we propose a numerical method for dimensional metrology of non-rigid parts in a free-state condition based on the arc length measurement by calculating the geodesic distance using the Fast Marching Method (FMM). In this thesis, we apply our developed methods on industrial non-rigid parts with free-form surfaces simulated with different types of

  10. Chemical profiles of body surfaces and nests from six Bornean stingless bee species.

    Leonhardt, Sara Diana; Blüthgen, Nico; Schmitt, Thomas

    2011-01-01

    Stingless bees (Apidae: Meliponini) are the most diverse group of Apid bees and represent common pollinators in tropical ecosystems. Like honeybees they live in large eusocial colonies and rely on complex chemical recognition and communication systems. In contrast to honeybees, their ecology and especially their chemical ecology have received only little attention, particularly in the Old World. We previously have analyzed the chemical profiles of six paleotropical stingless bee species from Borneo and revealed the presence of species-specific cuticular terpenes- an environmentally derived compound class so far unique among social insects. Here, we compared the bees' surface profiles to the chemistry of their nest material. Terpenes, alkanes, and alkenes were the dominant compound groups on both body surfaces and nest material. However, bee profiles and nests strongly differed in their chemical composition. Body surfaces thus did not merely mirror nests, rendering a passive compound transfer from nests to bees unlikely. The difference between nests and bees was particularly pronounced when all resin-derived compounds (terpenes) were excluded and only genetically determined compounds were considered. When terpenes were included, bee profiles and nest material still differed, because whole groups of terpenes (e.g., sesquiterpenes) were found in nest material of some species, but missing in their chemical profile, indicating that bees are able to influence the terpene composition both in their nests and on their surfaces.

  11. European Congress on Optics Applied to Metrology /METROP/, 2nd, Strasbourg, France, November 26-30, 1979, Proceedings

    Grosmann, M.; Meyrueis, P.

    1980-01-01

    The paper deals with speckle metrology, advances in classical optical metrology and measurement, and holographic metrology. Specific topics include hybrid holographic computer image processing, a speckle method of flow velocity measurement, the measurement of vibratory strains on turbine blades by speckle photography, the use of optical heterodyning and the Doppler effect in laser vibrometers and anemometers, subpicosecond dye lasers for optical metrology, and laser-beam scanning for remote control. Holographic interferometry of brittle materials is discussed, along with a system for the automatic analysis of holographic interferograms, the measurement of surface tension by holographic interferometry, nondestructive testing by means of holographic interferometry, real-time holographic interferometry of heat transfer at the surface of cold solar collectors, and the effective practical use of holography and related technologies in industry

  12. Surface layer and bloom dynamics observed with the Prince William Sound Autonomous Profiler

    Campbell, R. W.

    2016-02-01

    As part of a recent long term monitoring effort, deployments of a WETLabs Autonomous Moored Profiler (AMP) began Prince William Sound (PWS) in 2013. The PWS AMP consists of a positively buoyant instrument frame, with a winch and associated electronics that profiles the frame from a park depth (usually 55 m) to the surface by releasing and retrieving a thin UHMWPE tether; it generally conducts a daily cast and measures temperature, salinity, chlorophyll-a fluorescence, turbidity, and oxygen and nitrate concentrations. Upward and downward looking ADCPs are mounted on a float below the profiler, and an in situ plankton imager is in development and will be installed in 2016. Autonomous profilers are a relatively new technology, and early deployments experienced a number of failures from which valuable lessons may be learned. Nevertheless, an unprecedented time series of the seasonal biogeochemical procession in the surface waters coastal Gulf of Alaska was collected in 2014 and 2015. The northern Gulf of Alaska has experienced a widespread warm anomaly since early 2014, and surface layer temperature anomalies in PWS were strongly positive during winter 2014. The spring bloom observed by the profiler began 2-3 weeks earlier than average, with surface nitrate depleted by late April. Although surface temperatures were still above average in 2015, bloom timing was much later, with a short vigorous bloom in late April and a subsurface bloom in late May that coincided with significant nitrate drawdown. As well as the vernal blooms, wind-driven upwelling events lead to several small productivity pulses that were evident in changes in nitrate and oxygen concentrations, and chlorophyll-a fluorescence. As well as providing a mechanistic understanding of surface layer biogeochemistry, high frequency observations such as these put historical observations in context, and provide new insights into the scales of variability in the annual cycles of the surface ocean in the North

  13. New method of 2-dimensional metrology using mask contouring

    Matsuoka, Ryoichi; Yamagata, Yoshikazu; Sugiyama, Akiyuki; Toyoda, Yasutaka

    2008-10-01

    We have developed a new method of accurately profiling and measuring of a mask shape by utilizing a Mask CD-SEM. The method is intended to realize high accuracy, stability and reproducibility of the Mask CD-SEM adopting an edge detection algorithm as the key technology used in CD-SEM for high accuracy CD measurement. In comparison with a conventional image processing method for contour profiling, this edge detection method is possible to create the profiles with much higher accuracy which is comparable with CD-SEM for semiconductor device CD measurement. This method realizes two-dimensional metrology for refined pattern that had been difficult to measure conventionally by utilizing high precision contour profile. In this report, we will introduce the algorithm in general, the experimental results and the application in practice. As shrinkage of design rule for semiconductor device has further advanced, an aggressive OPC (Optical Proximity Correction) is indispensable in RET (Resolution Enhancement Technology). From the view point of DFM (Design for Manufacturability), a dramatic increase of data processing cost for advanced MDP (Mask Data Preparation) for instance and surge of mask making cost have become a big concern to the device manufacturers. This is to say, demands for quality is becoming strenuous because of enormous quantity of data growth with increasing of refined pattern on photo mask manufacture. In the result, massive amount of simulated error occurs on mask inspection that causes lengthening of mask production and inspection period, cost increasing, and long delivery time. In a sense, it is a trade-off between the high accuracy RET and the mask production cost, while it gives a significant impact on the semiconductor market centered around the mask business. To cope with the problem, we propose the best method of a DFM solution using two-dimensional metrology for refined pattern.

  14. Heterogeneous free-surface profile of B4C polycrystal under shock compression

    Mashimo, T.; Uchino, M.

    1997-01-01

    Observations of the free-surface behavior under shock compression by the gapped-flat mirror method were performed on B 4 C and Si 3 N 4 ceramics to study their shock-yielding properties. Jagged profiles of the moving free-surface in the plastic region, with a special scale of about one mm and a maximum local displacement of a few 10s of μm, were observed for B 4 C polycrystals. Similar profiles for Si 3 N 4 polycrystals were smooth. Such profiles for B 4 C polycrystals were also observed in the elastic region. It is suggested that these observations reflect the heterogeneous nature of shock compression in solids, and further indicate that a macroscopic slip system plays an important role in the elastoplastic transition of B 4 C material under shock compression and decompression. copyright 1997 American Institute of Physics

  15. Moving gantry method for electron beam dose profile measurement at extended source-to-surface distances.

    Fekete, Gábor; Fodor, Emese; Pesznyák, Csilla

    2015-03-08

    A novel method has been put forward for very large electron beam profile measurement. With this method, absorbed dose profiles can be measured at any depth in a solid phantom for total skin electron therapy. Electron beam dose profiles were collected with two different methods. Profile measurements were performed at 0.2 and 1.2 cm depths with a parallel plate and a thimble chamber, respectively. 108cm × 108 cm and 45 cm × 45 cm projected size electron beams were scanned by vertically moving phantom and detector at 300 cm source-to-surface distance with 90° and 270° gantry angles. The profiles collected this way were used as reference. Afterwards, the phantom was fixed on the central axis and the gantry was rotated with certain angular steps. After applying correction for the different source-to-detector distances and incidence of angle, the profiles measured in the two different setups were compared. Correction formalism has been developed. The agreement between the cross profiles taken at the depth of maximum dose with the 'classical' scanning and with the new moving gantry method was better than 0.5 % in the measuring range from zero to 71.9 cm. Inverse square and attenuation corrections had to be applied. The profiles measured with the parallel plate chamber agree better than 1%, except for the penumbra region, where the maximum difference is 1.5%. With the moving gantry method, very large electron field profiles can be measured at any depth in a solid phantom with high accuracy and reproducibility and with much less time per step. No special instrumentation is needed. The method can be used for commissioning of very large electron beams for computer-assisted treatment planning, for designing beam modifiers to improve dose uniformity, and for verification of computed dose profiles.

  16. Conductivity Profile Determination by Eddy Current for Shot Peened Superalloy Surfaces Toward Residual Stress Assessment

    Shen, Y.; Lo, C. C. H.; Frishman, A. M.; Lee, C.; Nakagawa, N.

    2007-01-01

    This paper describes an eddy current model-based method for inverting near-surface conductivity deviation profiles of surface treated materials from swept-high frequency eddy current (SHFEC) data. This work forms part of our current research directed towards the development of an electromagnetic nondestructive technique for assessing residual stress of shot-peened superalloy components. The inversion procedure is based on the use of a parameterized function to describe the near-surface conductivity as a function of depth for a shot-peened surface, and the laterally uniform multi-layer theory of Cheng, Dodd and Deeds to calculate the resulting coil impedance deviations. The convergence of the inversion procedure has been tested against synthesized eddy current data. As a demonstration, the conductivity deviation profiles of a series of Inconel 718 specimens, shot peened at various Almen intensities, have been obtained by inversion. Several consistency tests were conducted to examine the reliability of the inverted conductivity profiles. The results show that conductivity deviation profiles can be reliably determined from SHFEC data within the accuracy of the current measurement system

  17. Compact Wideband and Low-Profile Antenna Mountable on Large Metallic Surfaces

    Zhang, Shuai; Pedersen, Gert F.

    2017-01-01

    This paper proposes a compact wideband and low-profile antenna mountable on large metallic surfaces. Six rows of coupled microstrip resonators with different lengths are printed on a Teflon block. The lengths of the microstrip resonators in different rows are gradually reduced along the end-fire...

  18. Joint Research on Scatterometry and AFM Wafer Metrology

    Bodermann, B.; Buhr, E.; Danzebrink, H.U.; Bär, M.; Scholze, F.; Krumrey, M.; Wurm, M.; Klapetek, P.; Hansen, P.E.; Korpelainen, V.; Van Veghel, M.; Yacoot, A.; Siitonen, S.; El Gawhary, O.; Burger, S.; Saastamoinen, T.

    2011-01-01

    Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both

  19. Distributed large-scale dimensional metrology new insights

    Franceschini, Fiorenzo; Maisano, Domenico

    2011-01-01

    Focuses on the latest insights into and challenges of distributed large scale dimensional metrology Enables practitioners to study distributed large scale dimensional metrology independently Includes specific examples of the development of new system prototypes

  20. Speckle-based at-wavelength metrology of x-ray optics at Diamond Light Source

    Wang, Hongchang; Zhou, Tunhe; Kashyap, Yogesh; Sawhney, Kawal

    2017-08-01

    To achieve high resolution and sensitivity on the nanometer scale, further development of X-ray optics is required. Although ex-situ metrology provides valuable information about X-ray optics, the ultimate performance of X-ray optics is critically dependent on the exact nature of the working conditions. Therefore, it is equally important to perform in-situ metrology at the optics' operating wavelength (`at-wavelength' metrology) to optimize the performance of X-ray optics and correct and minimize the collective distortions of the upstream beamline optics, e.g. monochromator, windows, etc. Speckle-based technique has been implemented and further improved at Diamond Light Source. We have demonstrated that the angular sensitivity for measuring the slope error of an optical surface can reach an accuracy of two nanoradians. The recent development of the speckle-based at-wavelength metrology techniques will be presented. Representative examples of the applications of the speckle-based technique will also be given - including optimization of X-ray mirrors and characterization of compound refraction lenses. Such a high-precision metrology technique will be extremely beneficial for the manufacture and in-situ alignment/optimization of X-ray mirrors for next-generation synchrotron beamlines.

  1. Metrological AFMs and its application for versatile nano-dimensional metrology tasks

    Dai, Gaoliang; Dziomba, T.; Pohlenz, F.; Danzebrink, H.-U.; Koenders, L.

    2010-08-01

    Traceable calibrations of various micro and nano measurement devices are crucial tasks for ensuring reliable measurements for micro and nanotechnology. Today metrological AFM are widely used for traceable calibrations of nano dimensional standards. In this paper, we introduced the developments of metrological force microscopes at PTB. Of the three metrological AFMs described here, one is capable of measuring in a volume of 25 mm x 25 mm x 5 mm. All instruments feature interferometers and the three-dimensional position measurements are thus directly traceable to the metre definition. Some calibration examples on, for instance, flatness standards, step height standards, one and two dimensional gratings are demonstrated.

  2. ANALYSIS OF THE SURFACE PROFILE AND ITS MATERIAL SHARE DURING THE GRINDING INCONEL 718 ALLOY

    Martin Novák

    2015-05-01

    Full Text Available Grinding is still an important method for surface finishing. At FPTM JEPU research, which deals with this issue is conducted. Experiments are carried out with grinding various materials under different conditions and then selected components of the surface integrity are evaluated. They include roughness Ra, Rm and Rz, Material ratio curve (Abbott Firestone curve and also the obtained roundness. This article deals with grinding nickel Inconel 718 alloy, when selected cutting grinding conditions were used and subsequently the surface profile and the material ratio curve were measured and evaluated.

  3. Interoperability: linking design and tolerancing with metrology.

    Morse, Edward; Heysiattalab, Saeed; Barnard-Feeney, Allison; Hedberg, Thomas

    2016-01-01

    On October 30, 2014 the American National Standards Institute (ANSI) approved QIF v 2.0 (Quality Information Framework, version 2.0) as an American National Standard. Subsequently in early 2016 QIF version 2.1 was approved. This paper describes how the QIF standard models the information necessary for quality workflow across the full metrology enterprise. After a brief description of the XML 'language' used in the standard, the paper reports on how the standard enables information exchange among four major activities in the metrology enterprise (product definition; measurement planning; measurement execution; and the analysis and reporting of the quality data).

  4. Remote metrology system (RMS) design concept

    1995-01-01

    A 3D remote metrology system (RMS) is needed to map the interior plasma-facing components of the International Thermonuclear Experimental Reactor (ITER). The performance and survival of these components within the reactor vessel are strongly dependent on their precise alignment and positioning with respect to the plasma edge. Without proper positioning and alignment, plasma-facing surfaces will erode rapidly. A RMS design involving Coleman Research Corporation (CRC) fiber optic coherent laser radar (CLR) technology is examined in this study. The fiber optic CLR approach was selected because its high precision should be able to meet the ITER 0.1 mm accuracy requirement and because the CLR's fiber optic implementation allows a 3D scanner to operate remotely from the RMS system's vulnerable components. This design study has largely verified that a fiber optic CLR based RMS can survive the ITER environment and map the ITER interior at the required accuracy at a one measurement/cm 2 density with a total measurement time of less than one hour from each of six or more vertically deployed measurement probes. The design approach employs a sealed and pressurized measurement probe which is attached with an umbilical spiral bellows conduit. This conduit bears fiber optic and electronic links plus a stream of air to lower the temperature in the interior of the probe. Lowering the probe temperature is desirable because probe electromechanical components which could survive the radiation environment often were not rated for the 200 C temperature. The tip of the probe whose outer shell has a flexible bellows joint can swivel in two degrees of freedom to allow mapping operations at each probe deployment level. This design study has concluded that the most successful scanner design will involve a hybrid AO beam deflector and mechanical scanner

  5. Remote metrology system (RMS) design concept

    NONE

    1995-10-19

    A 3D remote metrology system (RMS) is needed to map the interior plasma-facing components of the International Thermonuclear Experimental Reactor (ITER). The performance and survival of these components within the reactor vessel are strongly dependent on their precise alignment and positioning with respect to the plasma edge. Without proper positioning and alignment, plasma-facing surfaces will erode rapidly. A RMS design involving Coleman Research Corporation (CRC) fiber optic coherent laser radar (CLR) technology is examined in this study. The fiber optic CLR approach was selected because its high precision should be able to meet the ITER 0.1 mm accuracy requirement and because the CLR`s fiber optic implementation allows a 3D scanner to operate remotely from the RMS system`s vulnerable components. This design study has largely verified that a fiber optic CLR based RMS can survive the ITER environment and map the ITER interior at the required accuracy at a one measurement/cm{sup 2} density with a total measurement time of less than one hour from each of six or more vertically deployed measurement probes. The design approach employs a sealed and pressurized measurement probe which is attached with an umbilical spiral bellows conduit. This conduit bears fiber optic and electronic links plus a stream of air to lower the temperature in the interior of the probe. Lowering the probe temperature is desirable because probe electromechanical components which could survive the radiation environment often were not rated for the 200 C temperature. The tip of the probe whose outer shell has a flexible bellows joint can swivel in two degrees of freedom to allow mapping operations at each probe deployment level. This design study has concluded that the most successful scanner design will involve a hybrid AO beam deflector and mechanical scanner.

  6. Remote Metrology, Mapping, and Motion Sensing of Plasma Facing Components Using FM Coherent Laser Radar

    Menon, M.M.; Barry, R.E.; Slotwinsky, A.; Kugel, H.W.; Skinner, C.H.

    2000-01-01

    Metrology inside a D/T burning fusion reactor must necessarily be conducted remotely since the in-vessel environment would be highly radioactive due to neutron activation of the torus walls. A technique based on frequency modulated coherent laser radar (FM CLR) for such remote metrology is described. Since the FM CLR relies on frequency shift to measure distances, the results are largely insensitive to surface reflectance characteristics. Results of measurements in TFTR and NSTX fusion devices using a prototype FM CLR unit, capable of remotely measuring distances (range) up to 22 m with better than 0.1-mm precision, are provided. These results illustrate that the FM CLR can be used for precision remote metrology as well as viewing. It is also shown that by conducting Doppler corrected range measurements using the CLR, the motion of objects can be tracked. Thus, the FM CLR has the potential to remotely measure the motion of plasma facing components (PFCs) during plasma disruptions

  7. A laser metrology/viewing system for ITER in-vessel inspection

    Spampinato, P.T.; Barry, R.E.; Chesser, J.B.; Herndon, J.N.; Menon, M.M.; Slotwinski, A.; Dagher, M.A.; Yuen, J.L.

    1998-01-01

    This paper identifies the requirements for the International Thermonuclear Experimental Reactor metrology and viewing system, and describes a remotely operated precision surface mapping system. A metrology system capable of achieving sub-millimeter accuracy must operate in a reactor vessel that has high gamma radiation, high vacuum, elevated temperature, and magnetic field. A coherent, frequency modulated laser radar system is under development to meet these requirements. The metrology/viewing sensor consists of a compact laser optics module linked through fiber optics to the laser source and imaging units, located outside the harsh environment. The deployment mechanism is a remotely operated telescopic-mast. Gamma irradiation to 10 7 Gy was conducted on critical sensor components at Oak Ridge National Laboratory, with no significant impact to data transmission, and analysis indicates that critical sensor components can operate in a magnetic field with certain design modifications. Plans for testing key components in a magnetic field are underway. (orig.)

  8. Development of laser materials processing and laser metrology techniques

    Kim, Cheol Jung; Chung, Chin Man; Kim, Jeong Mook; Kim, Min Suk; Kim, Kwang Suk; Baik, Sung Hoon; Kim, Seong Ouk; Park, Seung Kyu

    1997-09-01

    The applications of remote laser materials processing and metrology have been investigated in nuclear industry from the beginning of laser invention because they can reduce the risks of workers in the hostile environment by remote operation. The objective of this project is the development of laser material processing and metrology techniques for repairing and inspection to improve the safety of nuclear power plants. As to repairing, we developed our own laser sleeve welding head and innovative optical laser weld monitoring techniques to control the sleeve welding process. Furthermore, we designed and fabricated a 800 W Nd:YAG and a 150 W Excimer laser systems for high power laser materials processing in nuclear industry such as cladding and decontamination. As to inspection, we developed an ESPI and a laser triangulation 3-D profile measurement system for defect detection which can complement ECT and UT inspections. We also developed a scanning laser vibrometer for remote vibration measurement of large structures and tested its performance. (author). 58 refs., 16 tabs., 137 figs

  9. Quantitative depth profiling of near surface semiconductor structures using ultra low energy SIMS analysis

    Elliner, D.I.

    1999-09-01

    The continual reduction in size of semiconductor structures and depths of junctions is putting a greater strain on characterization techniques. Accurate device and process modelling requires quantified electrical and dopant profiles from the topmost few nanometres. Secondary ion mass spectrometry (SIMS) is an analytical technique commonly used in the semiconductor industry to measure concentration depth profiles. To allow the quantification of the features that are closer to the surface, lower energy ions are employed, which also improves the available depth resolution. The development of the floating ion gun (FLIG) has made it possible to use sub keV beam energies on a routine basis, allowing quantified dopant profiles to be obtained within the first few nanometres of the surface. This thesis demonstrates that, when profiling with oxygen ion beams, greatest certainty in the retained dose is achieved at normal incidence, and when analysing boron accurate profile shapes are only obtained when the primary beam energy is less than half that of the implant. It was shown that it is now possible to profile, though with slower erosion rates and a limited dynamic range, with 100 eV oxygen (0 2 + ) ion beams. Profile features that had developed during rapid thermal annealing, that could only be observed when ultra low energy ion beams were used, were investigated using various analytical techniques. Explanations of the apparently inactive dopant were proposed, and included suggestions for cluster molecules. The oxide thickness of fully formed altered layers has also been investigated. The results indicate that a fundamental change in the mechanism of oxide formation occurs, and interfaces that are sharper than those grown by thermal oxidation can be produced using sub-keV ion beams. (author)

  10. Measurement of surface temperature profiles on liquid uranium metal during electron beam evaporation

    Ohba, Hironori; Shibata, Takemasa [Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

    1998-11-01

    Surface temperature distributions of liquid uranium in a water-cooled copper crucible during electron beam evaporation were measured. Evaporation surface was imaged by a lens through a band-path filter (650{+-}5 nm) and a double mirror system on a charge coupled device (CCD) camera. The video signals of the recorded image were connected to an image processor and converted to two-dimensional spectral radiance profiles. The surface temperatures were obtained from the spectral radiation intensity ratio of the evaporation surface and a freezing point of uranium and/or a reference light source using Planck`s law of radiation. The maximum temperature exceeded 3000 K and had saturation tendency with increasing electron beam input. The measured surface temperatures agreed with those estimated from deposition rates and data of saturated vapor pressure of uranium. (author)

  11. Determining the near-surface current profile from measurements of the wave dispersion relation

    Smeltzer, Benjamin; Maxwell, Peter; Aesøy, Eirik; Ellingsen, Simen

    2017-11-01

    The current-induced Doppler shifts of waves can yield information about the background mean flow, providing an attractive method of inferring the current profile in the upper layer of the ocean. We present measurements of waves propagating on shear currents in a laboratory water channel, as well as theoretical investigations of inversion techniques for determining the vertical current structure. Spatial and temporal measurements of the free surface profile obtained using a synthetic Schlieren method are analyzed to determine the wave dispersion relation and Doppler shifts as a function of wavelength. The vertical current profile can then be inferred from the Doppler shifts using an inversion algorithm. Most existing algorithms rely on a priori assumptions of the shape of the current profile, and developing a method that uses less stringent assumptions is a focus of this study, allowing for measurement of more general current profiles. The accuracy of current inversion algorithms are evaluated by comparison to measurements of the mean flow profile from particle image velocimetry (PIV), and a discussion of the sensitivity to errors in the Doppler shifts is presented.

  12. A thermodynamic perturbation theory for the surface tension and ion density profile of a liquid metal

    Evans, R.; Kumaravadivel, R.

    1976-01-01

    A simple scheme for determining the ion density profile and the surface tension of a liquid metal is described. Assuming that the interaction between metallic pseudo-ions is of the form introduced by Evans, an approximate expression for the excess free energy of the system is derived using the thermodynamic perturbation theory of Weeks, Chandler and Anderson. This excess free energy is then minimized with respect to a parameter which specifies the ion density profile, and the surface tension is given directly. From a consideration of the dependence of the interionic forces on the electron density it is predicted that the ions should take up a very steep density profile at the liquid metal surface. This behaviour is contrasted with that to be expected for rare-gas fluids in which the interatomic forces are density-independent. The values of the surface tension calculated for liquid Na, K and Al from a simplified version of the theory are in reasonable agreement with experiment. (author)

  13. Metrological traceability of holmium oxide solution

    Gonçalves, D. E. F.; Gomes, J. F. S.; Alvarenga, A. P. D.; Borges, P. P.; Araujo, T. O.

    2018-03-01

    Holmium oxide solution was prepared as a candidate of certified reference material for spectrophotometer wavelength scale calibration. Here is presented the necessary steps for evaluation of the uncertainty and the establishment of metrological traceability for the production of this material. Preliminary results from the first produced batch are shown.

  14. Metrology Sampling Strategies for Process Monitoring Applications

    Vincent, Tyrone L.; Stirton, James Broc; Poolla, Kameshwar

    2011-01-01

    , economic pressures prompt a reduction in metrology, for both capital and cycle-time reasons. This paper explores the use of modeling and minimum-variance prediction as a method to select the sites for measurement on each wafer. The models are developed

  15. Laser metrology applied to the nuclear maintenance

    Garrido Garcia, J.; Sarti Fernandez, F.

    2012-01-01

    The development of this paper focuses on providing an overview of the state of the art about laser metrology. This type of equipment combines the measurement philosophy of laser scanning with the great precision of the robotic equipment of auscultation. Getting micron.

  16. Activities of IPEN Nuclear Metrology Laboratory

    Dias, M.S.; Koskinas, M.F.; Pocobi, E.; Silva, C.A.M.; Machado, R.R.

    1987-01-01

    The activities of IPEN Nuclear Metrology Laboratory, which the principal objective is radionuclides activities determination for supplying sources and standard radioactive solutions in activity are presented. The systems installed, the activity bands and some of standards radionuclides are shown. (C.G.C.) [pt

  17. Correlation methods in optical metrology with state-of-the-art x-ray mirrors

    Yashchuk, Valeriy V.; Centers, Gary; Gevorkyan, Gevork S.; Lacey, Ian; Smith, Brian V.

    2018-01-01

    The development of fully coherent free electron lasers and diffraction limited storage ring x-ray sources has brought to focus the need for higher performing x-ray optics with unprecedented tolerances for surface slope and height errors and roughness. For example, the proposed beamlines for the future upgraded Advance Light Source, ALS-U, require optical elements characterized by a residual slope error of optics with a length of up to one meter. However, the current performance of x-ray optical fabrication and metrology generally falls short of these requirements. The major limitation comes from the lack of reliable and efficient surface metrology with required accuracy and with reasonably high measurement rate, suitable for integration into the modern deterministic surface figuring processes. The major problems of current surface metrology relate to the inherent instrumental temporal drifts, systematic errors, and/or an unacceptably high cost, as in the case of interferometry with computer-generated holograms as a reference. In this paper, we discuss the experimental methods and approaches based on correlation analysis to the acquisition and processing of metrology data developed at the ALS X-Ray Optical Laboratory (XROL). Using an example of surface topography measurements of a state-of-the-art x-ray mirror performed at the XROL, we demonstrate the efficiency of combining the developed experimental correlation methods to the advanced optimal scanning strategy (AOSS) technique. This allows a significant improvement in the accuracy and capacity of the measurements via suppression of the instrumental low frequency noise, temporal drift, and systematic error in a single measurement run. Practically speaking, implementation of the AOSS technique leads to an increase of the measurement accuracy, as well as the capacity of ex situ metrology by a factor of about four. The developed method is general and applicable to a broad spectrum of high accuracy measurements.

  18. Global Properties of M31's Stellar Halo from the SPLASH Survey. I. Surface Brightness Profile

    Gilbert, Karoline M.; Guhathakurta, Puragra; Beaton, Rachael L.; Bullock, James; Geha, Marla C.; Kalirai, Jason S.; Kirby, Evan N.; Majewski, Steven R.; Ostheimer, James C.; Patterson, Richard J.; Tollerud, Erik J.; Tanaka, Mikito; Chiba, Masashi

    2012-11-01

    We present the surface brightness profile of M31's stellar halo out to a projected radius of 175 kpc. The surface brightness estimates are based on confirmed samples of M31 red giant branch stars derived from Keck/DEIMOS spectroscopic observations. A set of empirical spectroscopic and photometric M31 membership diagnostics is used to identify and reject foreground and background contaminants. This enables us to trace the stellar halo of M31 to larger projected distances and fainter surface brightnesses than previous photometric studies. The surface brightness profile of M31's halo follows a power law with index -2.2 ± 0.2 and extends to a projected distance of at least ~175 kpc (~2/3 of M31's virial radius), with no evidence of a downward break at large radii. The best-fit elliptical isophotes have b/a = 0.94 with the major axis of the halo aligned along the minor axis of M31's disk, consistent with a prolate halo, although the data are also consistent with M31's halo having spherical symmetry. The fact that tidal debris features are kinematically cold is used to identify substructure in the spectroscopic fields out to projected radii of 90 kpc and investigate the effect of this substructure on the surface brightness profile. The scatter in the surface brightness profile is reduced when kinematically identified tidal debris features in M31 are statistically subtracted; the remaining profile indicates that a comparatively diffuse stellar component to M31's stellar halo exists to large distances. Beyond 90 kpc, kinematically cold tidal debris features cannot be identified due to small number statistics; nevertheless, the significant field-to-field variation in surface brightness beyond 90 kpc suggests that the outermost region of M31's halo is also comprised to a significant degree of stars stripped from accreted objects. The data presented herein were obtained at the W. M. Keck Observatory, which is operated as a scientific partnership among the California

  19. Design and verification of the miniature optical system for small object surface profile fast scanning

    Chi, Sheng; Lee, Shu-Sheng; Huang, Jen, Jen-Yu; Lai, Ti-Yu; Jan, Chia-Ming; Hu, Po-Chi

    2016-04-01

    As the progress of optical technologies, different commercial 3D surface contour scanners are on the market nowadays. Most of them are used for reconstructing the surface profile of mold or mechanical objects which are larger than 50 mm×50 mm× 50 mm, and the scanning system size is about 300 mm×300 mm×100 mm. There are seldom optical systems commercialized for surface profile fast scanning for small object size less than 10 mm×10 mm×10 mm. Therefore, a miniature optical system has been designed and developed in this research work for this purpose. Since the most used scanning method of such system is line scan technology, we have developed pseudo-phase shifting digital projection technology by adopting projecting fringes and phase reconstruction method. A projector was used to project a digital fringe patterns on the object, and the fringes intensity images of the reference plane and of the sample object were recorded by a CMOS camera. The phase difference between the plane and object can be calculated from the fringes images, and the surface profile of the object was reconstructed by using the phase differences. The traditional phase shifting method was accomplished by using PZT actuator or precisely controlled motor to adjust the light source or grating and this is one of the limitations for high speed scanning. Compared with the traditional optical setup, we utilized a micro projector to project the digital fringe patterns on the sample. This diminished the phase shifting processing time and the controlled phase differences between the shifted phases become more precise. Besides, the optical path design based on a portable device scanning system was used to minimize the size and reduce the number of the system components. A screwdriver section about 7mm×5mm×5mm has been scanned and its surface profile was successfully restored. The experimental results showed that the measurement area of our system can be smaller than 10mm×10mm, the precision reached to

  20. Determination of the High Frequency Inductance Profile of Surface Mounted Permanent Magnet Synchronous Motors

    Lu, Kaiyuan; Rasmussen, Peter Omand; Ritchie, Ewen

    2008-01-01

    ) synchronous motors. This paper presents an AC+DC measurement method for determination of the d-axis and q-axis high frequency inductance profiles of SMPM synchronous motors. This method uses DC currents to set a desired magnetic working point on the motor laminations, and then superimpose balanced small AC......Accurate knowledge of the high frequency inductance profile plays an important role in many designs of sensorless controllers for Surface inductance. A special algorithm is used to decouple the cross-coupling effects between the d-axis and the q-axis, which allows Mounted Permanent Magnet (SMPM...... signals to measure the incremental a separate determination of the d, q inductance profiles as functions of the d, q currents. Experimental results on a commercial SMPM motor using the proposed method are presented in this paper....

  1. Deep Vs Profiling Along the Top of Yucca Mountain Using a Vibroseis Source and Surface Waves

    Stokoe, K.; Rosenblad, B.; Wong, I.; Bay, J.; Thomas, P.; Silva, W.

    2004-01-01

    Yucca Mountain, Nevada, was approved as the site for development of the geologic repository for high-level radioactive waste and spent nuclear fuel in the United States. The U.S. Department of Energy has been conducting studies to characterize the site and assess its future performance as a geologic repository. As part of these studies, a program of deep seismic profiling, to depths of 200 m, was conducted along the top of Yucca Mountain to evaluate the shear-wave velocity (V s ) structure of the repository block. The resulting V s data were used as input into the development of ground motions for the preclosure seismic design of the repository and for postclosure performance assessment. The noninvasive spectral-analysis-of-surface-waves (SASW) method was employed in the deep profiling. Field measurements involved the use of a modified Vibroseis as the seismic source. The modifications allowed the Vibroseis to be controlled by a signal analyzer so that slow frequency sweeps could be performed while simultaneous narrow-band filtering was performed on the receiver outputs. This process optimized input energy from the source and signal analysis of the receiver outputs. Six deep V s profiles and five intermediate-depth (about 100 m) profiles were performed along the top of Yucca Mountain over a distance of about 5 km. In addition, eleven shallower profiles (averaging about 45-m deep) were measured using a bulldozer source. The shallower profiles were used to augment the deeper profiles and to evaluate further the near-surface velocity structure. The V s profiles exhibit a strong velocity gradient within 5 m of the surface, with the mean V s value more than doubling. Below this depth, V s gradually increases from a mean value of about 900 to 1000 m/s at a depth of 150 m. Between the depths of 150 and 210 m, V s increases more rapidly to about 1350 m/s, but this trend is based on limited data. At depths less than 50 m, anisotropy in V s was measured for surveys conducted

  2. Overlay metrology for double patterning processes

    Leray, Philippe; Cheng, Shaunee; Laidler, David; Kandel, Daniel; Adel, Mike; Dinu, Berta; Polli, Marco; Vasconi, Mauro; Salski, Bartlomiej

    2009-03-01

    The double patterning (DPT) process is foreseen by the industry to be the main solution for the 32 nm technology node and even beyond. Meanwhile process compatibility has to be maintained and the performance of overlay metrology has to improve. To achieve this for Image Based Overlay (IBO), usually the optics of overlay tools are improved. It was also demonstrated that these requirements are achievable with a Diffraction Based Overlay (DBO) technique named SCOLTM [1]. In addition, we believe that overlay measurements with respect to a reference grid are required to achieve the required overlay control [2]. This induces at least a three-fold increase in the number of measurements (2 for double patterned layers to the reference grid and 1 between the double patterned layers). The requirements of process compatibility, enhanced performance and large number of measurements make the choice of overlay metrology for DPT very challenging. In this work we use different flavors of the standard overlay metrology technique (IBO) as well as the new technique (SCOL) to address these three requirements. The compatibility of the corresponding overlay targets with double patterning processes (Litho-Etch-Litho-Etch (LELE); Litho-Freeze-Litho-Etch (LFLE), Spacer defined) is tested. The process impact on different target types is discussed (CD bias LELE, Contrast for LFLE). We compare the standard imaging overlay metrology with non-standard imaging techniques dedicated to double patterning processes (multilayer imaging targets allowing one overlay target instead of three, very small imaging targets). In addition to standard designs already discussed [1], we investigate SCOL target designs specific to double patterning processes. The feedback to the scanner is determined using the different techniques. The final overlay results obtained are compared accordingly. We conclude with the pros and cons of each technique and suggest the optimal metrology strategy for overlay control in double

  3. Advanced metrology by offline SEM data processing

    Lakcher, Amine; Schneider, Loïc.; Le-Gratiet, Bertrand; Ducoté, Julien; Farys, Vincent; Besacier, Maxime

    2017-06-01

    Today's technology nodes contain more and more complex designs bringing increasing challenges to chip manufacturing process steps. It is necessary to have an efficient metrology to assess process variability of these complex patterns and thus extract relevant data to generate process aware design rules and to improve OPC models. Today process variability is mostly addressed through the analysis of in-line monitoring features which are often designed to support robust measurements and as a consequence are not always very representative of critical design rules. CD-SEM is the main CD metrology technique used in chip manufacturing process but it is challenged when it comes to measure metrics like tip to tip, tip to line, areas or necking in high quantity and with robustness. CD-SEM images contain a lot of information that is not always used in metrology. Suppliers have provided tools that allow engineers to extract the SEM contours of their features and to convert them into a GDS. Contours can be seen as the signature of the shape as it contains all the dimensional data. Thus the methodology is to use the CD-SEM to take high quality images then generate SEM contours and create a data base out of them. Contours are used to feed an offline metrology tool that will process them to extract different metrics. It was shown in two previous papers that it is possible to perform complex measurements on hotspots at different process steps (lithography, etch, copper CMP) by using SEM contours with an in-house offline metrology tool. In the current paper, the methodology presented previously will be expanded to improve its robustness and combined with the use of phylogeny to classify the SEM images according to their geometrical proximities.

  4. Mathematical description of tooth flank surface of globoidal worm gear with straight axial tooth profile

    Połowniak, Piotr; Sobolak, Mariusz

    2017-12-01

    In this article, a mathematical description of tooth flank surface of the globoidal worm and worm wheel generated by the hourglass worm hob with straight tooth axial profile is presented. The kinematic system of globoidal worm gear is shown. The equation of globoid helix and tooth axial profile of worm is derived to determine worm tooth surface. Based on the equation of meshing the contact lines are obtained. The mathematical description of globoidal worm wheel tooth flank is performed on the basis of contact lines and generating the tooth side by the extreme cutting edge of worm hob. The presented mathematical model of tooth flank of TA worm and worm wheel can be used e.g. to analyse the contact pattern of the gear.

  5. A Comparison Between Jerusalem Cross and Square Patch Frequency Selective Surfaces for Low Profile Antenna Applications

    Cure, David; Weller, Thomas; Miranda, Felix A.

    2011-01-01

    In this paper, a comparison between Jerusalem Cross (JC) and Square Patch (SP) based Frequency Selected Surfaces (FSS) for low profile antenna applications is presented. The comparison is aimed at understanding the performance of low profile antennas backed by high impedance surfaces. In particular, an end loaded planar open sleeve dipole (ELPOSD) antenna is examined due to the various parameters within its configuration, offering significant design flexibility and a wide operating bandwidth. Measured data of the antennas demonstrate that increasing the number of unit cells improves the fractional bandwidth. The antenna bandwidth increased from 0.8% to 1.8% and from 0.8% to 2.7% for the JC and SP structures, respectively. The number of unit cells was increased from 48 to 80 for the JC-FSS and from 24 to 48 for the SP-FSS.

  6. Reference metrology in a research fab: the NIST clean calibrations thrust

    Dixson, Ronald; Fu, Joe; Orji, Ndubuisi; Renegar, Thomas; Zheng, Alan; Vorburger, Theodore; Hilton, Al; Cangemi, Marc; Chen, Lei; Hernandez, Mike; Hajdaj, Russell; Bishop, Michael; Cordes, Aaron

    2009-03-01

    In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) - a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab - a 1765 m2 (19,000 ft2) clean room with 743 m2 (8000 ft2) of class 100 space - is the anchor of this facility and an integral component of the new Center for Nanoscale Science and Technology (CNST) at NIST. Although the CNST/NanoFab is a nanotechnology research facility with a different strategic focus than a current high volume semiconductor fab, metrology tools still play an important role in the nanofabrication research conducted here. Some of the metrology tools available to users of the NanoFab include stylus profiling, scanning electron microscopy (SEM), and atomic force microscopy (AFM). Since 2001, NIST has collaborated with SEMATECH to implement a reference measurement system (RMS) using critical dimension atomic force microscopy (CD-AFM). NIST brought metrology expertise to the table and SEMATECH provided access to leading edge metrology tools in their clean room facility in Austin. Now, in the newly launched "clean calibrations" thrust at NIST, we are implementing the reference metrology paradigm on several tools in the CNST/NanoFab. Initially, we have focused on calibration, monitoring, and uncertainty analysis for a three-tool set consisting of a stylus profiler, an SEM, and an AFM. Our larger goal is the development of new and supplemental calibrations and standards that will benefit from the Class 100 environment available in the NanoFab and offering our customers calibration options that do not require exposing their samples to less clean environments. Toward this end, we have completed a preliminary evaluation of the performance of these instruments. The results of these evaluations suggest that the achievable uncertainties are generally consistent with our measurement goals.

  7. An alternative method to achieve metrological confirmation in measurement process

    Villeta, M.; Rubio, E. M.; Sanz, A.; Sevilla, L.

    2012-04-01

    Metrological confirmation process must be designed and implemented to ensure that metrological characteristics of the measurement system meet metrological requirements of the measurement process. The aim of this paper is to present an alternative method to the traditional metrological requirements about the relationship between tolerance and measurement uncertainty, to develop such confirmation processes. The proposed way to metrological confirmation considers a given inspection task of the measurement process into the manufacturing system, and it is based on the Index of Contamination of the Capability, ICC. Metrological confirmation process is then developed taking into account the producer risks and economic considerations on this index. As a consequence, depending on the capability of the manufacturing process, the measurement system will be or will not be in adequate state of metrological confirmation for the measurement process.

  8. From Intensity Profile to Surface Normal: Photometric Stereo for Unknown Light Sources and Isotropic Reflectances.

    Lu, Feng; Matsushita, Yasuyuki; Sato, Imari; Okabe, Takahiro; Sato, Yoichi

    2015-10-01

    We propose an uncalibrated photometric stereo method that works with general and unknown isotropic reflectances. Our method uses a pixel intensity profile, which is a sequence of radiance intensities recorded at a pixel under unknown varying directional illumination. We show that for general isotropic materials and uniformly distributed light directions, the geodesic distance between intensity profiles is linearly related to the angular difference of their corresponding surface normals, and that the intensity distribution of the intensity profile reveals reflectance properties. Based on these observations, we develop two methods for surface normal estimation; one for a general setting that uses only the recorded intensity profiles, the other for the case where a BRDF database is available while the exact BRDF of the target scene is still unknown. Quantitative and qualitative evaluations are conducted using both synthetic and real-world scenes, which show the state-of-the-art accuracy of smaller than 10 degree without using reference data and 5 degree with reference data for all 100 materials in MERL database.

  9. Simulations geometric structures of the stepped profile bearing surface of the piston

    Wroblewski Emil

    2017-01-01

    Full Text Available The main node piston-pin-piston rings are most responsible for the formation of mechanical losses. It is advisable to reduce friction losses in the piston-cylinder group lead to an increase in the overall efficiency of the engine and thus reduce the fuel consumption. The method to reduce the area covered by the oil film is a modification of the bearing surface of the piston by adjusting the profile. In this paper the results of simulation for the stepped microgeometry piston bearing surface are presented.

  10. Surface profiling of normally responding and nonreleasing basophils by flow cytometry

    Kistrup, Kasper; Poulsen, Lars Kærgaard; Jensen, Bettina Margrethe

    a maximum release blood mononuclear cells were purified by density centrifugation and using flow cytometry, basophils, defined as FceRIa+CD3-CD14-CD19-CD56-,were analysed for surface expression of relevant markers. All samples were compensated and analysed in logicle display. All gates......c, C3aR, C5aR CCR3, FPR1, ST2, CRTH2 on anti-IgE respondsive and nonreleasing basophils by flow cytometry, thereby generating a surface profile of the two phenotypes. Methods Fresh buffy coat blood (

  11. Highly multiplexed and quantitative cell-surface protein profiling using genetically barcoded antibodies.

    Pollock, Samuel B; Hu, Amy; Mou, Yun; Martinko, Alexander J; Julien, Olivier; Hornsby, Michael; Ploder, Lynda; Adams, Jarrett J; Geng, Huimin; Müschen, Markus; Sidhu, Sachdev S; Moffat, Jason; Wells, James A

    2018-03-13

    Human cells express thousands of different surface proteins that can be used for cell classification, or to distinguish healthy and disease conditions. A method capable of profiling a substantial fraction of the surface proteome simultaneously and inexpensively would enable more accurate and complete classification of cell states. We present a highly multiplexed and quantitative surface proteomic method using genetically barcoded antibodies called phage-antibody next-generation sequencing (PhaNGS). Using 144 preselected antibodies displayed on filamentous phage (Fab-phage) against 44 receptor targets, we assess changes in B cell surface proteins after the development of drug resistance in a patient with acute lymphoblastic leukemia (ALL) and in adaptation to oncogene expression in a Myc-inducible Burkitt lymphoma model. We further show PhaNGS can be applied at the single-cell level. Our results reveal that a common set of proteins including FLT3, NCR3LG1, and ROR1 dominate the response to similar oncogenic perturbations in B cells. Linking high-affinity, selective, genetically encoded binders to NGS enables direct and highly multiplexed protein detection, comparable to RNA-sequencing for mRNA. PhaNGS has the potential to profile a substantial fraction of the surface proteome simultaneously and inexpensively to enable more accurate and complete classification of cell states. Copyright © 2018 the Author(s). Published by PNAS.

  12. An Assessment of Critical Dimension Small Angle X-ray Scattering Metrology for Advanced Semiconductor Manufacturing

    Settens, Charles M. [State Univ. of New York (SUNY), Albany, NY (United States)

    2015-01-01

    Simultaneous migration of planar transistors to FinFET architectures, the introduction of a plurality of materials to ensure suitable electrical characteristics, and the establishment of reliable multiple patterning lithography schemes to pattern sub-10 nm feature sizes imposes formidable challenges to current in-line dimensional metrologies. Because the shape of a FinFET channel cross-section immediately influences the electrical characteristics, the evaluation of 3D device structures requires measurement of parameters beyond traditional critical dimension (CD), including their sidewall angles, top corner rounding and footing, roughness, recesses and undercuts at single nanometer dimensions; thus, metrologies require sub-nm and approaching atomic level measurement uncertainty. Synchrotron critical dimension small angle X-ray scattering (CD-SAXS) has unique capabilities to non-destructively monitor the cross-section shape of surface structures with single nanometer uncertainty and can perform overlay metrology to sub-nm uncertainty. In this dissertation, we perform a systematic experimental investigation using CD-SAXS metrology on a hierarchy of semiconductor 3D device architectures including, high-aspect-ratio contact holes, H2 annealed Si fins, and a series of grating type samples at multiple points along a FinFET fabrication process increasing in structural intricacy and ending with fully fabricated FinFET. Comparative studies between CD-SAXS metrology and other relevant semiconductor dimensional metrologies, particularly CDSEM, CD-AFM and TEM are used to determine physical limits of CD-SAXS approach for advanced semiconductor samples. CD-SAXS experimental tradeoffs, advice for model-dependent analysis and thoughts on the compatibility with a semiconductor manufacturing environment are discussed.

  13. Characterization and Metrology for ULSI Technology: 1998 International Conference. Proceedings

    Seiler, D.G. [NIST, Gaithersburg, MD 20899 (United States); Diebold, A.C. [SEMATECH, Austin, TX 78741 (United States); Bullis, W.M. [SEMI, Mountain View, CA 94043 (United States); Schaffner, T.J. [Texas Instruments, Dallas, TX 75221 (United States); McDonald, R. [Intel Corp., Santa Clara, CA 95050 (United States); Walters, E.J. [NIST, Gaithersburg, MD 20899 (United States)

    1998-11-01

    These proceedings represent papers presented at the 1998 International Conference on Characterization and Metrology for ULSI Technology (INIST) in March 1998. The Conference reviewed important semiconductor techniques that are crucial to continued advancements in the semiconductor industry. It brought together leaders, scientists, and engineers concerned with all aspects of the technology and characterization techniques for silicon research. The topics covered included front end processes consisting of modeling, materials, gate dielectrics, doping and wafer issues. Interconnects were discussed in detail including deposition technology. Lithography and patterning was also discussed. Finally, packaging/assembly of the integrated circuits and materials characterization including dopant profiling was discussed. The papers provide an effective portrayal of industry characterization needs and point out some of the problems that must be addressed by industry, academia, and government to continue the dramatic progress in semiconductor technology. There were 141 papers included in these proceedings, out of which 9 have been abstracted for the Energy,Science and Technology database.(AIP)

  14. An Optimal Estimation Method to Obtain Surface Layer Turbulent Fluxes from Profile Measurements

    Kang, D.

    2015-12-01

    In the absence of direct turbulence measurements, the turbulence characteristics of the atmospheric surface layer are often derived from measurements of the surface layer mean properties based on Monin-Obukhov Similarity Theory (MOST). This approach requires two levels of the ensemble mean wind, temperature, and water vapor, from which the fluxes of momentum, sensible heat, and water vapor can be obtained. When only one measurement level is available, the roughness heights and the assumed properties of the corresponding variables at the respective roughness heights are used. In practice, the temporal mean with large number of samples are used in place of the ensemble mean. However, in many situations the samples of data are taken from multiple levels. It is thus desirable to derive the boundary layer flux properties using all measurements. In this study, we used an optimal estimation approach to derive surface layer properties based on all available measurements. This approach assumes that the samples are taken from a population whose ensemble mean profile follows the MOST. An optimized estimate is obtained when the results yield a minimum cost function defined as a weighted summation of all error variance at each sample altitude. The weights are based one sample data variance and the altitude of the measurements. This method was applied to measurements in the marine atmospheric surface layer from a small boat using radiosonde on a tethered balloon where temperature and relative humidity profiles in the lowest 50 m were made repeatedly in about 30 minutes. We will present the resultant fluxes and the derived MOST mean profiles using different sets of measurements. The advantage of this method over the 'traditional' methods will be illustrated. Some limitations of this optimization method will also be discussed. Its application to quantify the effects of marine surface layer environment on radar and communication signal propagation will be shown as well.

  15. Adaptive Sampling based 3D Profile Measuring Method for Free-Form Surface

    Duan, Xianyin; Zou, Yu; Gao, Qiang; Peng, Fangyu; Zhou, Min; Jiang, Guozhang

    2018-03-01

    In order to solve the problem of adaptability and scanning efficiency of the current surface profile detection device, a high precision and high efficiency detection approach is proposed for surface contour of free-form surface parts based on self- adaptability. The contact mechanical probe and the non-contact laser probe are synthetically integrated according to the sampling approach of adaptive front-end path detection. First, the front-end path is measured by the non-contact laser probe, and the detection path is planned by the internal algorithm of the measuring instrument. Then a reasonable measurement sampling is completed according to the planned path by the contact mechanical probe. The detection approach can effectively improve the measurement efficiency of the free-form surface contours and can simultaneously detect the surface contours of unknown free-form surfaces with different curvatures and even different rate of curvature. The detection approach proposed in this paper also has important reference value for free-form surface contour detection.

  16. Surface profile measurement by using the integrated Linnik WLSI and confocal microscope system

    Wang, Wei-Chung; Shen, Ming-Hsing; Hwang, Chi-Hung; Yu, Yun-Ting; Wang, Tzu-Fong

    2017-06-01

    The white-light scanning interferometer (WLSI) and confocal microscope (CM) are the two major optical inspection systems for measuring three-dimensional (3D) surface profile (SP) of micro specimens. Nevertheless, in practical applications, WLSI is more suitable for measuring smooth and low-slope surfaces. On the other hand, CM is more suitable for measuring uneven-reflective and low-reflective surfaces. As for aspect of surface profiles to be measured, the characteristics of WLSI and CM are also different. WLSI is generally used in semiconductor industry while CM is more popular in printed circuit board industry. In this paper, a self-assembled multi-function optical system was integrated to perform Linnik white-light scanning interferometer (Linnik WLSI) and CM. A connecting part composed of tubes, lenses and interferometer was used to conjunct finite and infinite optical systems for Linnik WLSI and CM in the self-assembled optical system. By adopting the flexibility of tubes and lenses, switching to perform two different optical measurements can be easily achieved. Furthermore, based on the shape from focus method with energy of Laplacian filter, the CM was developed to enhance the on focal information of each pixel so that the CM can provide all-in-focus image for performing the 3D SP measurement and analysis simultaneously. As for Linnik WLSI, eleven-step phase shifting algorithm was used to analyze vertical scanning signals and determine the 3D SP.

  17. Profiles

    2004-01-01

    Profiles is a synthetic overview of more than 100 national energy markets in the world, providing insightful facts and key energy statistics. A Profile is structured around 6 main items and completed by key statistics: Ministries, public agencies, energy policy are concerned; main companies in the oil, gas, electricity and coal sectors, status, shareholders; reserve, production, imports and exports, electricity and refining capacities; deregulation of prices, subsidies, taxes; consumption trends by sector, energy market shares; main energy projects, production and consumption prospects. Statistical Profiles are present in about 3 pages the main data and indicators on oil, gas, coal and electricity. (A.L.B.)

  18. Surface reflectance drives nest box temperature profiles and thermal suitability for target wildlife.

    Stephen R Griffiths

    Full Text Available Thermal properties of tree hollows play a major role in survival and reproduction of hollow-dependent fauna. Artificial hollows (nest boxes are increasingly being used to supplement the loss of natural hollows; however, the factors that drive nest box thermal profiles have received surprisingly little attention. We investigated how differences in surface reflectance influenced temperature profiles of nest boxes painted three different colors (dark-green, light-green, and white: total solar reflectance 5.9%, 64.4%, and 90.3% respectively using boxes designed for three groups of mammals: insectivorous bats, marsupial gliders and brushtail possums. Across the three different box designs, dark-green (low reflectance boxes experienced the highest average and maximum daytime temperatures, had the greatest magnitude of variation in daytime temperatures within the box, and were consistently substantially warmer than light-green boxes (medium reflectance, white boxes (high reflectance, and ambient air temperatures. Results from biophysical model simulations demonstrated that variation in diurnal temperature profiles generated by painting boxes either high or low reflectance colors could have significant ecophysiological consequences for animals occupying boxes, with animals in dark-green boxes at high risk of acute heat-stress and dehydration during extreme heat events. Conversely in cold weather, our modelling indicated that there are higher cumulative energy costs for mammals, particularly smaller animals, occupying light-green boxes. Given their widespread use as a conservation tool, we suggest that before boxes are installed, consideration should be given to the effect of color on nest box temperature profiles, and the resultant thermal suitability of boxes for wildlife, particularly during extremes in weather. Managers of nest box programs should consider using several different colors and installing boxes across a range of both orientations and

  19. Analytical study on optically measured surface profiles of referential geometry using a finite-difference time-domain method

    Fujii, A; Hayashi, S; Fujii, S; Yanagi, K

    2014-01-01

    This paper deals with the functional performance of optical surface texture measuring instruments on the market. It is well known that their height response curves against certain referential geometry are not always identical to each other. So, a more precise study on the optical instrument's characteristics is greatly needed. Firstly, we developed a new simulation tool using a finite-difference time-domain technique, which enables the prediction of the height response curve against the fundamental surface geometry in the case of the confocal laser scanning microscope. Secondly, by utilizing this new simulation tool, measurement results, including outliers, were compared with the analytical simulation results. The comparison showed the consistency, which indicates that necessary conditions of surface measurement standards for verifying the instrument performance can be established. Consequently, we suggest that the maximum measurable slope angle must be added to evaluation subjects as significant metrological characteristics of measuring instruments, along with the lateral period limit. Finally, we propose a procedure to determine the lateral period limit in an ISO standard. (paper)

  20. Line printing solution-processable small molecules with uniform surface profile via ink-jet printer.

    Liu, Huimin; Xu, Wei; Tan, Wanyi; Zhu, Xuhui; Wang, Jian; Peng, Junbiao; Cao, Yong

    2016-03-01

    Line printing offers a feasible approach to remove the pixel well structure which is widely used to confine the ink-jet printed solution. In the study, a uniform line is printed by an ink-jet printer. To achieve a uniform surface profile of the printed line, 10vol% low-volatile solvent DMA (3,4-Dimethylanisole) is mixed with high-volatile solvent Pxy (p-xylene) as the solvent. After a solution-processable small molecule is dissolved, the surface tension of DMA solution becomes lower than that of Pxy solution, which creates an inward Marangoni flow during the solvent evaporation. The inward Marangoni flow balances out the outward capillary flow, thereby forming a flat film surface. The line width of the printed line depends on the contact angle of the solution on the hole injection layer. Copyright © 2015 Elsevier Inc. All rights reserved.

  1. Radial Surface Density Profiles of Gas and Dust in the Debris Disk around 49 Ceti

    Hughes, A. Meredith; Lieman-Sifry, Jesse; Flaherty, Kevin M.; Daley, Cail M. [Department of Astronomy, Van Vleck Observatory, Wesleyan University, 96 Foss Hill Drive, Middletown, CT 06459 (United States); Roberge, Aki [Exoplanets and Stellar Astrophysics Laboratory, NASA Goddard Space Flight Center, Code 667, Greenbelt, MD 20771 (United States); Kóspál, Ágnes; Moór, Attila; Ábrahám, Peter [Konkoly Observatory, Research Centre for Astronomy and Earth Sciences, Hungarian Academy of Sciences, P.O. Box 67, 1525 Budapest (Hungary); Kamp, Inga [Kapteyn Astronomical Institute, University of Groningen, Postbus 800, 9700 AV Groningen (Netherlands); Wilner, David J.; Andrews, Sean M. [Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, MS-51, Cambridge, MA 02138 (United States); Kastner, Joel H., E-mail: amhughes@astro.wesleyan.edu [Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY 14623 (United States)

    2017-04-20

    We present ∼0.″4 resolution images of CO(3–2) and associated continuum emission from the gas-bearing debris disk around the nearby A star 49 Ceti, observed with the Atacama Large Millimeter/Submillimeter Array (ALMA). We analyze the ALMA visibilities in tandem with the broadband spectral energy distribution to measure the radial surface density profiles of dust and gas emission from the system. The dust surface density decreases with radius between ∼100 and 310 au, with a marginally significant enhancement of surface density at a radius of ∼110 au. The SED requires an inner disk of small grains in addition to the outer disk of larger grains resolved by ALMA. The gas disk exhibits a surface density profile that increases with radius, contrary to most previous spatially resolved observations of circumstellar gas disks. While ∼80% of the CO flux is well described by an axisymmetric power-law disk in Keplerian rotation about the central star, residuals at ∼20% of the peak flux exhibit a departure from axisymmetry suggestive of spiral arms or a warp in the gas disk. The radial extent of the gas disk (∼220 au) is smaller than that of the dust disk (∼300 au), consistent with recent observations of other gas-bearing debris disks. While there are so far only three broad debris disks with well characterized radial dust profiles at millimeter wavelengths, 49 Ceti’s disk shows a markedly different structure from two radially resolved gas-poor debris disks, implying that the physical processes generating and sculpting the gas and dust are fundamentally different.

  2. Vertical profiles of aerosol optical properties over central Illinois and comparison with surface and satellite measurements

    P. J. Sheridan

    2012-12-01

    Full Text Available Between June 2006 and September 2009, an instrumented light aircraft measured over 400 vertical profiles of aerosol and trace gas properties over eastern and central Illinois. The primary objectives of this program were to (1 measure the in situ aerosol properties and determine their vertical and temporal variability and (2 relate these aircraft measurements to concurrent surface and satellite measurements. The primary profile location was within 15 km of the NOAA/ESRL surface aerosol monitoring station near Bondville, Illinois. Identical instruments at the surface and on the aircraft ensured that the data from both platforms would be directly comparable and permitted a determination of how representative surface aerosol properties were of the lower column. Aircraft profiles were also conducted occasionally at two other nearby locations to increase the frequency of A-Train satellite underflights for the purpose of comparing in situ and satellite-retrieved aerosol data. Measurements of aerosol properties conducted at low relative humidity over the Bondville site compare well with the analogous surface aerosol data and do not indicate any major sampling issues or that the aerosol is radically different at the surface compared with the lowest flyby altitude of ~ 240 m above ground level. Statistical analyses of the in situ vertical profile data indicate that aerosol light scattering and absorption (related to aerosol amount decreases substantially with increasing altitude. Parameters related to the nature of the aerosol (e.g., single-scattering albedo, Ångström exponent, etc., however, are relatively constant throughout the mixed layer, and do not vary as much as the aerosol amount throughout the profile. While individual profiles often showed more variability, the median in situ single-scattering albedo was 0.93–0.95 for all sampled altitudes. Several parameters (e.g., submicrometer scattering fraction, hemispheric backscattering fraction, and

  3. Machine tool metrology an industrial handbook

    Smith, Graham T

    2016-01-01

    Maximizing reader insights into the key scientific disciplines of Machine Tool Metrology, this text will prove useful for the industrial-practitioner and those interested in the operation of machine tools. Within this current level of industrial-content, this book incorporates significant usage of the existing published literature and valid information obtained from a wide-spectrum of manufacturers of plant, equipment and instrumentation before putting forward novel ideas and methodologies. Providing easy to understand bullet points and lucid descriptions of metrological and calibration subjects, this book aids reader understanding of the topics discussed whilst adding a voluminous-amount of footnotes utilised throughout all of the chapters, which adds some additional detail to the subject. Featuring an extensive amount of photographic-support, this book will serve as a key reference text for all those involved in the field. .

  4. Quantum metrology foundation of units and measurements

    Goebel, Ernst O

    2015-01-01

    The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the...

  5. Metrology for fire experiments in outdoor conditions

    Silvani, Xavier

    2013-01-01

    Natural fires can be considered as scale-dependant, non-linear processes of mass, momentum and heat transport, resulting from a turbulent reactive and radiative fluid medium flowing over a complex medium, the vegetal fuel. In natural outdoor conditions, the experimental study of natural fires at real scale needs the development of an original metrology, one able to capture the large range of time and length scales involved in its dynamic nature and also able to resist the thermal, mechanical and chemical aggression of flames on devices. Robust, accurate and poorly intrusive tools must be carefully set-up and used for gaining very fluctuating data over long periods. These signals also need the development of original post-processing tools that take into account the non-steady nature of their stochastic components. Metrology for Fire Experiments in Outdoor Conditions closely analyzes these features, and also describes measurements techniques, the thermal insulation of fragile electronic systems, data acquisitio...

  6. Coordinate Metrology by Traceable Computed Tomography

    Müller, Pavel

    is an important factor for decision making about manufactured parts. However, due to many influences in CT, estimation of the uncertainty is a challenge, also because standardized procedures and guidelines are not available yet. In this thesis, several methods for uncertainty estimation were applied in connection......, characterization and correction of measurement errors in the CT volume. Their application appeared to be suitable for this task. Because the two objects consist of ruby spheres and carbon fibre, CT scans did not produce image artifacts, and evaluation of sphere-to-sphere distances was robust. Several methods...... metrology and coordinate metrology and is currently becoming more and more important measuring technique for dimensional measurements. This is mainly due to the fact that with CT, a complete three-dimensional model of the scanned part is in a relatively short time visualized using a computer...

  7. Efficiency improvements of offline metrology job creation

    Zuniga, Victor J.; Carlson, Alan; Podlesny, John C.; Knutrud, Paul C.

    1999-06-01

    Progress of the first lot of a new design through the production line is watched very closely. All performance metrics, cycle-time, in-line measurement results and final electrical performance are critical. Rapid movement of this lot through the line has serious time-to-market implications. Having this material waiting at a metrology operation for an engineer to create a measurement job plan wastes valuable turnaround time. Further, efficient use of a metrology system is compromised by the time required to create and maintain these measurement job plans. Thus, having a method to develop metrology job plans prior to the actual running of the material through the manufacture area can significantly improve both cycle time and overall equipment efficiency. Motorola and Schlumberger have worked together to develop and test such a system. The Remote Job Generator (RJG) created job plans for new device sin a manufacturing process from an NT host or workstation, offline. This increases available system tim effort making production measurements, decreases turnaround time on job plan creation and editing, and improves consistency across job plans. Most importantly this allows job plans for new devices to be available before the first wafers of the device arrive at the tool for measurement. The software also includes a database manager which allows updates of existing job plans to incorporate measurement changes required by process changes or measurement optimization. This paper will review the result of productivity enhancements through the increased metrology utilization and decreased cycle time associated with the use of RJG. Finally, improvements in process control through better control of Job Plans across different devices and layers will be discussed.

  8. Measurement capabilities of the Bendix Metrology Organization

    Barnes, L.M.

    1984-01-01

    The purpose of this manual is to communicate the measurement and calibration capabilities of the Metrology Organization of the Bendix Kansas City Division. Included is a listing of the measurement types and ranges available, and the accuracies normally attainable under conditions at the Kansas City Division. Also described are currently used standards and measurement devices. The manual is divided into four major sections, each describing a broad general area of measurement: mechanical; environmental, gas, liquid; electrical; and optical and radiation

  9. Digital holography for MEMS and microsystem metrology

    Asundi, Anand

    2011-01-01

    Approaching the topic of digital holography from the practical perspective of industrial inspection, Digital Holography for MEMS and Microsystem Metrology describes the process of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation, and device testing and inspection. Asundi also provides a thorough theoretical grounding that enables the reader to understand basic concepts and thus identify areas where this technique can be adopted. This combination of both practical and theoretical approach will ensure the

  10. Implementation of the Brazilian radiation metrology network

    Ramos, Manoel M.O.; Araujo, Margareth M. de

    1998-01-01

    The ever increasing need for calibration of survey, personal, and contamination meters in Brazil are not completely satisfied by the two operating laboratories. To overcome this deficiency a radiation metrology network is being implemented with the support of IAEA. In a near future this network will count other three calibration laboratories which are being installed in different regions of the country, and accredited through INMETRO. (author)

  11. Traceability and uncertainty estimation in coordinate metrology

    Hansen, Hans Nørgaard; Savio, Enrico; De Chiffre, Leonardo

    2001-01-01

    National and international standards have defined performance verification procedures for coordinate measuring machines (CMMs) that typically involve their ability to measure calibrated lengths and to a certain extent form. It is recognised that, without further analysis or testing, these results...... are required. Depending on the requirements for uncertainty level, different approaches may be adopted to achieve traceability. Especially in the case of complex measurement situations and workpieces the procedures are not trivial. This paper discusses the establishment of traceability in coordinate metrology...

  12. Manufacturing and metrology for IR conformal windows and domes

    Ferralli, Ian; Blalock, Todd; Brunelle, Matt; Lynch, Timothy; Myer, Brian; Medicus, Kate

    2017-05-01

    Freeform and conformal optics have the potential to dramatically improve optical systems by enabling systems with fewer optical components, reduced aberrations, and improved aerodynamic performance. These optical components differ from standard components in their surface shape, typically a non-symmetric equation based definition, and material properties. Traditional grinding and polishing tools are unable to handle these freeform shapes. Additionally, standard metrology tools cannot measure these surfaces. Desired substrates are typically hard ceramics, including poly-crystalline alumina or aluminum oxynitride. Notwithstanding the challenges that the hardness provides to manufacturing, these crystalline materials can be highly susceptible to grain decoration creating unacceptable scatter in optical systems. In this presentation, we will show progress towards addressing the unique challenges of manufacturing conformal windows and domes. Particular attention is given to our robotic polishing platform. This platform is based on an industrial robot adapted to accept a wide range of tooling and parts. The robot's flexibility has provided us an opportunity to address the unique challenges of conformal windows. Slurries and polishing active layers can easily be changed to adapt to varying materials and address grain decoration. We have the flexibility to change tool size and shape to address the varying sizes and shapes of conformal optics. In addition, the robotic platform can be a base for a deflectometry-based metrology tool to measure surface form error. This system, whose precision is independent of the robot's positioning accuracy, will allow us to measure optics in-situ saving time and reducing part risk. In conclusion, we will show examples of the conformal windows manufactured using our developed processes.

  13. Metrology Techniques for the Assembly of NCSX

    Priniski, C.; Dodson, T.; Duco, M.; Raftopoulos, S.; Ellis, R.; Brooks, A.

    2009-01-01

    In support of the National Compact Stellerator Experiment (NCSX), stellerator assembly activities continued this past year at the Princeton Plasma Physics Laboratory (PPPL) in partnership with the Oak Ridge National Laboratory (ORNL). The construction program saw the completion of the first two Half Field-Period Assemblies (HPA), each consisting of three modular coils. The full machine includes six such sub-assemblies. A single HPA consists of three of the NCSX modular coils wound and assembled at PPPL. These geometrically-complex three dimensional coils were wound using computer-aided metrology and CAD models to tolerances within +/- 0.5mm. The assembly of these coils required similar accuracy on a larger scale with the added complexity of more individual parts and fewer degrees of freedom for correction. Several new potential positioning issues developed for which measurement and control techniques were developed. To accomplish this, CAD coordinate-based computer metrology equipment and software similar to the solutions employed for winding the modular coils was used. Given the size of the assemblies, the primary tools were both interferometer aided and Absolute Distance Measurement (ADM)-only based laser trackers. In addition, portable Coordinate Measurement Machine (CMM) arms and some novel indirect measurement techniques were employed. This paper will detail both the use of CAD coordinate-based metrology technology and the techniques developed and employed for dimensional control of NSCX subassemblies. The results achieved and possible improvements to techniques will be discussed.

  14. On the extension of the wind profile over homogeneous terrain beyond the surface boundary layer

    Gryning, Sven-Erik; Batchvarova, Ekaterina; Brümmer, B.

    2007-01-01

    -Obukhov similarity. Above the surface layer the second length scale (L-MBL ) becomes independent of height but not of stability, and at the top of the boundary layer the third length scale is assumed to be negligible. A simple model for the combined length scale that controls the wind profile and its stability...... dependence is formulated by inverse summation. Based on these assumptions the wind profile for the entire boundary layer is derived. A parameterization of L-MBL is formulated using the geostrophic drag law, which relates friction velocity and geostrophic wind. The empirical parameterization of the resistance...... law functions A and B in the geostrophic drag law is uncertain, making it impractical. Therefore an expression for the length scale, L-MBL , for applied use is suggested, based on measurements from the two sites....

  15. Modelling of composition and stress profiles in low temperature surface engineered stainless steel

    Jespersen, Freja Nygaard; Hattel, Jesper Henri; Somers, Marcel A. J.

    2015-01-01

    temperature, time and gas composition is a prerequisite for targeted process optimization. A realistic model to simulate the developing case has to take the following influences on composition and stress into account: - a concentration dependent diffusion coefficient - trapping of nitrogen by chromium atoms...... stresses are introduced in the developing case, arising from the volume expansion that accompanies the dissolution of high interstitial contents in expanded austenite. Modelling of the composition and stress profiles developing during low temperature surface engineering from the processing parameters...... - the effect of residual stress on diffusive flux - the effect of residual stress on solubility of interstitials - plastic accommodation of residual stress. The effect of all these contributions on composition and stress profiles will be addressed....

  16. Geometric Parameters of Cutting Tools that Can be Used for Forming Sided Surfaces with Variable Profile

    Razumov M.

    2017-03-01

    Full Text Available This article describes machining technology of polyhedral surfaces with varying profile, which is provided by planetary motion of multiblade block tools. The features of the technology and urgency of the problem is indicated. The purpose of the study is to determine the minimum value of the clearance angle of the tool. Also, the study is carried out about changing the value of the front and rear corners during the formation of polygonal surface using a planetary gear. The scheme of calculating the impact of various factors on the value of the minimum clearance angle of the tool and kinematic front and rear corners of the instrument is provided. The mathematical formula for calculating the minimum clearance angle of the tool is given. Also, given the formula for determining the front and rear corners of the tool during driving. This study can be used in the calculation of the design operations forming multifaceted external surfaces with a variable profile by using the planetary gear.

  17. Slovak Office of Standards, Metrology and Testing. Annual Report 2001

    2002-01-01

    A brief account of activities carried out by the Slovak Office of Standards, Metrology and Testing of the Slovak Republic in 2001 is presented. These activities are reported under the headings: (1) Introduction by the President of the Slovak Office of Standards, Metrology and Testing; (2) The Vice-president's Unit Standardization and Quality; (3) The President's Office; (4) Chief Inspector Department; (5) Legislative-juridical Department; (6) Department of Economy; (7) Department of International Co-operation; (8) Department of European Integration; (9) Department of Metrology; (10) Department of Testing; (11) Department of the Cyclotron Centre SR; (12) Slovak Institute of Metrology; (13) Slovak Standards Institution; (14) Slovak Metrology Inspectorate; (15) Slovak Legal Metrology; (16) Measuring Techniques - Technocentre - MTT; Abbreviations; (17) Technical Testing Institute Piestany; (18) Testing Institute of Transport and Earthmoving Machinery - SUDST

  18. 7th International Workshop on Advanced Optical Imaging and Metrology

    2014-01-01

    In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imagi...

  19. Surface damage and gas trapping profile measurements in copper during 20 kev He+ irradiation

    Terreault, B.; Veilleux, G.

    1980-01-01

    Surface damage due to 20 keV he + irradiation of OFHC Cu was studied by optical and scanning electron microscopy, and by gas trapping profile measurements with proton backscattering and elastic recoil detection. Both annealed (1 h at 773 K) and unannealed Cu were implanted, at 300 K (0.22Tsub(m)) and 500 K(0.37 Tsub(m)), up to fluences of 3 x 10 18 cm -2 . Additional results with thin (1 μm) evaporated films and stressed cold-rolled foils (3 μm) were obtained. At 500 K in bulk OFHC Cu pores and/or large (approx. 1μm) but scattered blisters appear; at 300 K in bulk or thin film Cu blisters are large and abundant. In all these cases a very large (>=1.5 x 10 1 7 cm -2 ) and sudden release of deeply implanted helium takes place, leading to a depleted profile at a depth of about 90 nm (approx. Rsub(p)). In contrast in cold-rolled foils the blisters are small (approx. 0.4 μm) and the profiles are undepleted. These results are explained by fissuration of helium-pressurized cavities. At high fluence blisters disappear, leaving a porous structure at 500 K and a rough micro-relief at 300 K; the helim profiles are flat and very wide (2-3 Rsub(p)). Blister disappearance, absence of flaking, and porous structure are discussed in terms of the width of the profiles and the formation of a helium-saturated, highly damaged (recrystallized), and permeable layer. (orig.)

  20. Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy.

    Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

    2016-05-01

    X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or "tophat" beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

  1. Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

    Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal, E-mail: kawal.sawhney@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE (United Kingdom)

    2016-05-15

    X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

  2. Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy

    Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal

    2016-01-01

    X-ray active mirrors, such as bimorph and mechanically bendable mirrors, are increasingly being used on beamlines at modern synchrotron source facilities to generate either focused or “tophat” beams. As well as optical tests in the metrology lab, it is becoming increasingly important to optimise and characterise active optics under actual beamline operating conditions. Recently developed X-ray speckle-based at-wavelength metrology technique has shown great potential. The technique has been established and further developed at the Diamond Light Source and is increasingly being used to optimise active mirrors. Details of the X-ray speckle-based at-wavelength metrology technique and an example of its applicability in characterising and optimising a micro-focusing bimorph X-ray mirror are presented. Importantly, an unprecedented angular sensitivity in the range of two nanoradians for measuring the slope error of an optical surface has been demonstrated. Such a super precision metrology technique will be beneficial to the manufacturers of polished mirrors and also in optimization of beam shaping during experiments.

  3. Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

    Alfeld, Matthias; Broekaert, José A.C.

    2013-01-01

    Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings

  4. Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

    Alfeld, Matthias, E-mail: matthias.alfeld@desy.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany); University of Antwerp, Department of Chemistry, Groenenbrogerlaan 171, B-2020 Antwerp (Belgium); Broekaert, José A.C., E-mail: jose.broekaert@chemie.uni-hamburg.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany)

    2013-10-01

    Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings.

  5. Rayleigh beacon for measuring the surface profile of a radio telescope.

    Padin, S

    2014-12-01

    Millimeter-wavelength Rayleigh scattering from water droplets in a cloud is proposed as a means of generating a bright beacon for measuring the surface profile of a radio telescope. A λ=3  mm transmitter, with an output power of a few watts, illuminating a stratiform cloud, can generate a beacon with the same flux as Mars in 10 GHz bandwidth, but the beacon has a narrow line width, so it is extremely bright. The key advantage of the beacon is that it can be used at any time, and positioned anywhere in the sky, as long as there are clouds.

  6. Surface coil imaging of the spine using fast sequences: Improvement of intensity profile and contrast behavior

    Requardt, H.; Deimling, M.; Weber, H.

    1986-01-01

    Sagittal and axial images obtained using a surface coil suffer from the extreme intensity profile caused by physical properties of the coil and the anatomic entity of subcutaneous fat. The authors present a measuring device that reduces these disadvantages by means of Helmholtz-type coils, and sequences that reduce the fat signal by dephasing its signal part. The extremely short repetition time (<30 msec) allows acquisition times shorter than 10 sec. Breath-holding for this short period to avoid movement artifacts is possible. Images are presented that illustrate the enhanced contrast of spinal tissue and surrounding structures. Comparisons are made with spin-echo and CHESS images

  7. Investigation of surface residual stress profile on martensitic stainless steel weldment with X-ray diffraction

    I.I. Ahmed

    2018-04-01

    Full Text Available The development of residual stresses during fabrication is inevitable and often neglected with dire consequences during the service life of the fabricated components. In this work, the surface residual stress profile following the martensitic stainless steel (MSS pipe welding was investigated with X-ray diffraction technique. The results revealed the presence of residual stresses equilibrated across the weldment zones. Tensile residual stress observed in weld metal was balanced by compressive residual stresses in the parent material on the opposing sides of weld metal. Keywords: Residual stress, Weld, Stainless steel, X-ray, HAZ

  8. Metrology for radioactive waste management. (WP2, WP3)

    Suran, J.

    2014-01-01

    The three-year European research project M etrology for Radioactive Waste Management' was launched in October 2011 under the EMRP (European Metrology Research Programme). It involves 13 European national metrology institutes and a total budget exceeds four million Euros. The project is coordinated by the Czech Metrology Institute and is divided into five working groups. In this presentation the Project is described. (author)

  9. PREFACE: Fundamental Constants in Physics and Metrology

    Klose, Volkmar; Kramer, Bernhard

    1986-01-01

    This volume contains the papers presented at the 70th PTB Seminar which, the second on the subject "Fundamental Constants in Physics and Metrology", was held at the Physikalisch-Technische Bundesanstalt in Braunschweig from October 21 to 22, 1985. About 100 participants from the universities and various research institutes of the Federal Republic of Germany participated in the meeting. Besides a number of review lectures on various broader subjects there was a poster session which contained a variety of topical contributed papers ranging from the theory of the quantum Hall effect to reports on the status of the metrological experiments at the PTB. In addition, the participants were also offered the possibility to visit the PTB laboratories during the course of the seminar. During the preparation of the meeting we noticed that even most of the general subjects which were going to be discussed in the lectures are of great importance in connection with metrological experiments and should be made accessible to the scientific community. This eventually resulted in the idea of the publication of the papers in a regular journal. We are grateful to the editor of Metrologia for providing this opportunity. We have included quite a number of papers from basic physical research. For example, certain aspects of high-energy physics and quantum optics, as well as the many-faceted role of Sommerfeld's fine-structure constant, are covered. We think that questions such as "What are the intrinsic fundamental parameters of nature?" or "What are we doing when we perform an experiment?" can shed new light on the art of metrology, and do, potentially, lead to new ideas. This appears to be especially necessary when we notice the increasing importance of the role of the fundamental constants and macroscopic quantum effects for the definition and the realization of the physical units. In some cases we have reached a point where the limitations of our knowledge of a fundamental constant and

  10. Design, fabrication and metrological evaluation of wearable pressure sensors.

    Goy, C B; Menichetti, V; Yanicelli, L M; Lucero, J B; López, M A Gómez; Parodi, N F; Herrera, M C

    2015-04-01

    Pressure sensors are valuable transducers that are necessary in a huge number of medical application. However, the state of the art of compact and lightweight pressure sensors with the capability of measuring the contact pressure between two surfaces (contact pressure sensors) is very poor. In this work, several types of wearable contact pressure sensors are fabricated using different conductive textile materials and piezo-resistive films. The fabricated sensors differ in size, the textile conductor used and/or the number of layers of the sandwiched piezo-resistive film. The intention is to study, through the obtaining of their calibration curves, their metrological properties (repeatability, sensitivity and range) and determine which physical characteristics improve their ability for measuring contact pressures. It has been found that it is possible to obtain wearable contact pressure sensors through the proposed fabrication process with satisfactory repeatability, range and sensitivity; and that some of these properties can be improved by the physical characteristics of the sensors.

  11. Silver nanoparticles: technological advances, societal impacts, and metrological challenges

    Calderón-Jiménez, Bryan; Johnson, Monique E.; Montoro Bustos, Antonio R.; Murphy, Karen E.; Winchester, Michael R.; Vega Baudrit, José R.

    2017-02-01

    Silver nanoparticles (AgNPs) show different physical and chemical properties compared to their macroscale analogs. This is primarily due to their small size and, consequently, the exceptional surface area of these materials. Presently, advances in the synthesis, stabilization, and production of AgNPs have fostered a new generation of commercial products and intensified scientific investigation within the nanotechnology field. The use of AgNPs in commercial products is increasing and impacts on the environment and human health are largely unknown. This article discusses advances in AgNP production and presents an overview of the commercial, societal, and environmental impacts of this emerging nanoparticle (NP), and nanomaterials in general. Finally, we examine the challenges associated with AgNP characterization, discuss the importance of the development of NP reference materials (RMs) and explore their role as a metrological mechanism to improve the quality and comparability of NP measurements.

  12. Development of Electromechanical Architectures for AC Voltage Metrology

    Alexandre BOUNOUH

    2010-12-01

    Full Text Available This paper presents results of work undertaken for exploring MEMS capabilities to fabricate AC voltage references for electrical metrology and high precision instrumentation through the mechanical-electrical coupling in MEMS. From first MEMS test structures previously realized, a second set of devices with improved characteristics has been developed and fabricated with Silicon on Insulator (SOI Surface Micromachining process. These MEMS exhibit pull-in voltages of 5 V and 10 V to match with the best performance of the read-out electronics developed for driving the MEMS. Deep Level Transient Spectroscopy measurements carried out on the new design show resonance frequencies of about only some kHz, and the stability of the MEMS output voltage measured at 100 kHz has been found very promising for the best samples where the relative deviation from the mean value over almost 12 hours showed a standard deviation of about 6.3 ppm.

  13. Silver Nanoparticles: Technological Advances, Societal Impacts, and Metrological Challenges.

    Calderón-Jiménez, Bryan; Johnson, Monique E; Montoro Bustos, Antonio R; Murphy, Karen E; Winchester, Michael R; Vega Baudrit, José R

    2017-01-01

    Silver nanoparticles (AgNPs) show different physical and chemical properties compared to their macroscale analogs. This is primarily due to their small size and, consequently, the exceptional surface area of these materials. Presently, advances in the synthesis, stabilization, and production of AgNPs have fostered a new generation of commercial products and intensified scientific investigation within the nanotechnology field. The use of AgNPs in commercial products is increasing and impacts on the environment and human health are largely unknown. This article discusses advances in AgNP production and presents an overview of the commercial, societal, and environmental impacts of this emerging nanoparticle (NP), and nanomaterials in general. Finally, we examine the challenges associated with AgNP characterization, discuss the importance of the development of NP reference materials (RMs) and explore their role as a metrological mechanism to improve the quality and comparability of NP measurements.

  14. Problems of metrological supply of carbon materials production

    Belov, G.V.; Bazilevskij, L.P.; Cherkashina, N.V.

    1989-01-01

    Carbon materials and products contain internal residual stresses and have an anisotropy of properties therefore special methods of tests are required to control their quality. The main metrological problems during development, production and application of carbon products are: metrological supply of production forms and records during the development of production conditions; metrological supply of quality control of the product; metrological supply of methods for the tests of products and the methods to forecast the characteristics of product quality for the period of quaranteed service life

  15. Surface waves at the interface with an antisymmetric gain/loss profile

    Ctyroky, Jiri; Kuzmiak, Vladimir; Eyderman, Sergey

    2010-01-01

    We studied properties of strongly guiding two-mode waveguides with antisymmetric gain/loss profile which constitute photonic analogues of quantum mechanical structures with parity-time symmetry breaking. For both TE and TM polarizations, the dependences of effective indices of the guided modes vs. gain/loss coefficient exhibit a degenerate critical point that defines two regimes with profoundly different behavior. In addition, we have shown that the interface between the two media supports propagation of a strongly confined non-attenuated TM polarized surface wave. We examined the properties of the surface wave obtained by both the modal and FDTD method and discuss the differences between the results obtained by both techniques as both the material and geometrical parameters are varied.

  16. Exploring the Plant–Microbe Interface by Profiling the Surface-Associated Proteins of Barley Grains

    Sultan, Abida; Andersen, Birgit; Svensson, Birte

    2016-01-01

    Cereal grains are colonized by a microbial community that actively interacts with the plant via secretion of various enzymes, hormones, and metabolites. Microorganisms decompose plant tissues by a collection of depolymerizing enzymes, including β-1,4-xylanases, that are in turn inhibited by plant...... xylanase inhibitors. To gain insight into the importance of the microbial consortia and their interaction with barley grains, we used a combined gel-based (2-DE coupled to MALDI-TOF-TOF MS) and gel-free (LC–MS/MS) proteomics approach complemented with enzyme activity assays to profile the surface......-associated proteins and xylanolytic activities of two barley cultivars. The surface-associated proteome was dominated by plant proteins with roles in defense and stress-responses, while the relatively less abundant microbial (bacterial and fungal) proteins were involved in cell-wall and polysaccharide degradation...

  17. Shear wave profiles from surface wave inversion: the impact of uncertainty on seismic site response analysis

    Boaga, J; Vignoli, G; Cassiani, G

    2011-01-01

    Inversion is a critical step in all geophysical techniques, and is generally fraught with ill-posedness. In the case of seismic surface wave studies, the inverse problem can lead to different equivalent subsoil models and consequently to different local seismic response analyses. This can have a large impact on an earthquake engineering design. In this paper, we discuss the consequences of non-uniqueness of surface wave inversion on seismic responses, with both numerical and experimental data. Our goal is to evaluate the consequences on common seismic response analysis in the case of different impedance contrast conditions. We verify the implications of inversion uncertainty, and consequently of data information content, on realistic local site responses. A stochastic process is used to generate a set of 1D shear wave velocity profiles from several specific subsurface models. All these profiles are characterized as being equivalent, i.e. their responses, in terms of a dispersion curve, are compatible with the uncertainty in the same surface wave data. The generated 1D shear velocity models are then subjected to a conventional one-dimensional seismic ground response analysis using a realistic input motion. While recent analyses claim that the consequences of surface wave inversion uncertainties are very limited, our test points out that a relationship exists between inversion confidence and seismic responses in different subsoils. In the case of regular and relatively smooth increase of shear wave velocities with depth, as is usual in sedimentary plains, our results show that the choice of a specific model among equivalent solutions strongly influences the seismic response. On the other hand, when the shallow subsoil is characterized by a strong impedance contrast (thus revealing a characteristic soil resonance period), as is common in the presence of a shallow bedrock, equivalent solutions provide practically the same seismic amplification, especially in the

  18. Combined analysis of surface reflection imaging and vertical seismic profiling at Yucca Mountain, Nevada

    Daley, T.M.; Majer, E.L.; Karageorgi, E.

    1994-08-01

    This report presents results from surface and borehole seismic profiling performed by the Lawrence Berkeley Laboratory (LBL) on Yucca Mountain. This work was performed as part of the site characterization effort for the potential high-level nuclear waste repository. Their objective was to provide seismic imaging from the near surface (200 to 300 ft. depth) to the repository horizon and below, if possible. Among the issues addressed by this seismic imaging work are location and depth of fracturing and faulting, geologic identification of reflecting horizons, and spatial continuity of reflecting horizons. The authors believe their results are generally positive, with tome specific successes. This was the first attempt at this scale using modem seismic imaging techniques to determine geologic features on Yucca Mountain. The principle purpose of this report is to present the interpretation of the seismic reflection section in a geologic context. Three surface reflection profiles were acquired and processed as part of this study. Because of environmental concerns, all three lines were on preexisting roads. Line 1 crossed the mapped surface trace of the Ghost Dance fault and it was intended to study the dip and depth extent of the fault system. Line 2 was acquired along Drill Hole wash and was intended to help the ESF north ramp design activities. Line 3 was acquired along Yucca Crest and was designed to image geologic horizons which were thought to be less faulted along the ridge. Unfortunately, line 3 proved to have poor data quality, in part because of winds, poor field conditions and limited time. Their processing and interpretation efforts were focused on lines 1 and 2 and their associated VSP studies

  19. Vertical Profiles of Aerosol Optical Properties Over Central Illinois and Comparison with Surface and Satellite Measurements

    Sheridan P. J.; Andrews, E.; Ogren, J A.; Tackett, J. L.; Winker, D. M.

    2012-01-01

    Between June 2006 and September 2009, an instrumented light aircraft measured over 400 vertical profiles of aerosol and trace gas properties over eastern and central Illinois. The primary objectives of this program were to (1) measure the in situ aerosol properties and determine their vertical and temporal variability and (2) relate these aircraft measurements to concurrent surface and satellite measurements. Underflights of the CALIPSO satellite show reasonable agreement in a majority of retrieved profiles between aircraft-measured extinction at 532 nm (adjusted to ambient relative humidity) and CALIPSO-retrieved extinction, and suggest that routine aircraft profiling programs can be used to better understand and validate satellite retrieval algorithms. CALIPSO tended to overestimate the aerosol extinction at this location in some boundary layer flight segments when scattered or broken clouds were present, which could be related to problems with CALIPSO cloud screening methods. The in situ aircraft-collected aerosol data suggest extinction thresholds for the likelihood of aerosol layers being detected by the CALIOP lidar. These statistical data offer guidance as to the likelihood of CALIPSO's ability to retrieve aerosol extinction at various locations around the globe.

  20. Difference in Dwarf Galaxy Surface Brightness Profiles as a Function of Environment

    Lee, Youngdae; Park, Hong Soo; Kim, Sang Chul; Moon, Dae-Sik; Lee, Jae-Joon; Kim, Dong-Jin; Cha, Sang-Mok

    2018-05-01

    We investigate surface brightness profiles (SBPs) of dwarf galaxies in field, group, and cluster environments. With deep BV I images from the Korea Microlensing Telescope Network Supernova Program, SBPs of 38 dwarfs in the NGC 2784 group are fitted by a single-exponential or double-exponential model. We find that 53% of the dwarfs are fitted with single-exponential profiles (“Type I”), while 47% of the dwarfs show double-exponential profiles; 37% of all dwarfs have smaller sizes for the outer part than the inner part (“Type II”), while 10% have a larger outer than inner part (“Type III”). We compare these results with those in the field and in the Virgo cluster, where the SBP types of 102 field dwarfs are compiled from a previous study and the SBP types of 375 cluster dwarfs are measured using SDSS r-band images. As a result, the distributions of SBP types are different in the three environments. Common SBP types for the field, the NGC 2784 group, and the Virgo cluster are Type II, Type I and II, and Type I and III profiles, respectively. After comparing the sizes of dwarfs in different environments, we suggest that since the sizes of some dwarfs are changed due to environmental effects, SBP types are capable of being transformed and the distributions of SBP types in the three environments are different. We discuss possible environmental mechanisms for the transformation of SBP types. Based on data collected at KMTNet Telescopes and SDSS.

  1. OCT-based profiler for automating ocular surface prosthetic fitting (Conference Presentation)

    Mujat, Mircea; Patel, Ankit H.; Maguluri, Gopi N.; Iftimia, Nicusor V.; Patel, Chirag; Agranat, Josh; Tomashevskaya, Olga; Bonte, Eugene; Ferguson, R. Daniel

    2016-03-01

    The use of a Prosthetic Replacement of the Ocular Surface Environment (PROSE) device is a revolutionary treatment for military patients that have lost their eyelids due to 3rd degree facial burns and for civilians who suffer from a host of corneal diseases. However, custom manual fitting is often a protracted painful, inexact process that requires multiple fitting sessions. Training for new practitioners is a long process. Automated methods to measure the complete corneal and scleral topology would provide a valuable tool for both clinicians and PROSE device manufacturers and would help streamline the fitting process. PSI has developed an ocular anterior-segment profiler based on Optical Coherence Tomography (OCT), which provides a 3D measure of the surface of the sclera and cornea. This device will provide topography data that will be used to expedite and improve the fabrication process for PROSE devices. OCT has been used to image portions of the cornea and sclera and to measure surface topology for smaller contact lenses [1-3]. However, current state-of-the-art anterior eye OCT systems can only scan about 16 mm of the eye's anterior surface, which is not sufficient for covering the sclera around the cornea. In addition, there is no systematic method for scanning and aligning/stitching the full scleral/corneal surface and commercial segmentation software is not optimized for the PROSE application. Although preliminary, our results demonstrate the capability of PSI's approach to generate accurate surface plots over relatively large areas of the eye, which is not currently possible with any other existing platform. Testing the technology on human volunteers is currently underway at Boston Foundation for Sight.

  2. On the effectiveness of surface assimilation in probabilistic nowcasts of planetary boundary layer profiles

    Rostkier-Edelstein, Dorita; Hacker, Joshua

    2013-04-01

    Surface observations comprise a wide, non-expensive and reliable source of information about the state of the near-surface planetary boundary layer (PBL). Operational data assimilation systems have encountered several difficulties in effectively assimilating them, among others due to their local-scale representativeness, the transient coupling between the surface and the atmosphere aloft and the balance constraints usually used. A long-term goal of this work is to find an efficient system for probabilistic PBL nowcasting that can be employed wherever surface observations are present. Earlier work showed that surface observations can be an important source of information with a single column model (SCM) and an ensemble filter (EF). Here we extend that work to quantify the probabilistic skill of ensemble SCM predictions with a model including added complexity. We adopt a factor separation analysis to quantify the contribution of surface assimilation relative to that of selected model components (parameterized radiation and externally imposed horizontal advection) to the probabilistic skill of the system, and of any beneficial or detrimental interactions between them. To assess the real utility of the flow-dependent covariances estimated with the EF and of the SCM of the PBL we compare the skill of the SCM/EF system to that of a reference one based on climatological covariances and a 30-min persistence model. It consists of a dressing technique, whereby a deterministic 3D mesoscale forecast (e.g. from WRF model) is adjusted and dressed with uncertainty using a seasonal sample of mesoscale forecasts and surface forecast errors. Results show that assimilation of surface observations can improve deterministic and probabilistic profile predictions more significantly than major model improvements. Flow-dependent covariances estimated with the SCM/EF show clear advantage over the use of climatological covariances when the flow is characterized by wide variability, when

  3. 3D Surface Profile and Color Stability of Tooth Colored Filling Materials after Bleaching

    Bryant Anthony Irawan

    2015-01-01

    Full Text Available This study aims to evaluate the effects of vital tooth bleaching with carbamide peroxide home bleaching and in-office bleaching on the color stability and 3D surface profile of dental restorative filling materials. Thirty discs (n=30 measure 6 mm in diameter and 2 mm thick for each of three restorative materials. These are nanofilled composite Filtek Z350 XT, the submicron composite Estelite Σ Quick, and nanofilled glass ionomer Ketac N100 nanoionomer and were fabricated in shade A2. Each group was further divided into three subgroups (n=10: subgroup A (Opalescence PF, subgroup B (Opalescence Boost in-office bleaching, and subgroup C (distilled water serving as control. Samples were bleached according to the manufacturer’s instructions for a period of two weeks. The Commission Internationale de L’Eclairage (CIE L*, a*, b* system was chosen for image processing, while 3D surface profile was tested with atomic force microscopy (AFM. Statistical analyses were performed with the Mann-Whitney tests and Krusal-Wallis with a P value of ≤0.05. The three restorative materials showed significant color changes (ΔE; P≤0.05. In diminishing order, the mean color changes recorded were Estelite Σ (3.82 ± 1.6 > Ketac Nano (2.97 ± 1.2 > Filtek Z350 XT (2.25 ± 1.0. However, none of the tested materials showed statistically significant changes in surface roughness; P>0.05.

  4. Deep and surface circulation in the Northwest Indian Ocean from Argo, surface drifter, and in situ profiling current observations

    Stryker, S. A.; Dimarco, S. F.; Stoessel, M. M.; Wang, Z.

    2010-12-01

    The northwest Indian Ocean is a region of complex circulation and atmospheric influence. The Persian (Arabian) Gulf and Red Sea contribute toward the complexity of the region. This study encompasses the surface and deep circulation in the region ranging from 0°N-35°N and 40°E-80°E from January 2002-December 2009. Emphasis is in the Persian Gulf, Oman Sea and Arabian Sea (roughly from 21°N-26°N and 56°E-63°E) using a variety of in situ and observation data sets. While there is a lot known about the Persian Gulf and Arabian Sea, little is known about the Oman Sea. Circulation in the northwest Indian Ocean is largely influenced by seasonal monsoon winds. From the winter monsoon to the summer monsoon, current direction reverses. Marginal sea inflow and outflow are also seasonally variable, which greatly impacts the physical water mass properties in the region. In situ and observation data sets include data from Argo floats (US GODAE), surface drifters (AOML) and an observation system consisting of 4 independent moorings and a cabled ocean observatory in the Oman Sea. The observing system in the Oman Sea was installed by Lighthouse R & D Enterprises, Inc. beginning in 2005, and measures current, temperature, conductivity, pressure, dissolved oxygen and turbidity, using the Aanderaa Recording Doppler Current Profiler (RDCP) 600 and the Aanderaa Recording Current Meter (RCM) 11. The cabled ocean observatory measures dissolved oxygen, temperature and salinity between 65 m and 1000 m and reports in real-time. Argo floats in the region have a parking depth range from 500 m to 2000 m. At 1000 m depth, 98% of the velocity magnitudes range from less than 1 cm/s to 20 cm/s. The Somali Current and Northeast/Southwest Monsoon Currents are present, reversing from summer to winter. At 2000 m depth, the Somali and Monsoon Currents are still present but have smaller velocities with 98% ranging from less than 1 cm/s to 13 cm/s. At both 1000 m and 2000 m, larger velocities occur

  5. 222Rn gas metrology in Latvia

    Bogucarska, T.; Lapenas, A.

    2004-01-01

    The measurements of radon gas provides in Latvia according with the State radiation monitoring program. The national standard/reference level for the protection of employees and population from exposure to radon Latvia has been accepted. The facilities for calibration of the radon gas measurement instruments and detectors have been established on basic of the Radiation Metrology and Testing Center which is the local SSDL for Baltic Region. The radon measurement instruments and detectors calibration can be performed at the 170-4000 Bq/m 3 range. (author)

  6. Quantum metrology for gravitational wave astronomy.

    Schnabel, Roman; Mavalvala, Nergis; McClelland, David E; Lam, Ping K

    2010-11-16

    Einstein's general theory of relativity predicts that accelerating mass distributions produce gravitational radiation, analogous to electromagnetic radiation from accelerating charges. These gravitational waves (GWs) have not been directly detected to date, but are expected to open a new window to the Universe once the detectors, kilometre-scale laser interferometers measuring the distance between quasi-free-falling mirrors, have achieved adequate sensitivity. Recent advances in quantum metrology may now contribute to provide the required sensitivity boost. The so-called squeezed light is able to quantum entangle the high-power laser fields in the interferometer arms, and could have a key role in the realization of GW astronomy.

  7. Aerosol metrology: aerodynamic and electrostatic techniques

    Prodi, V.

    1988-01-01

    Aerosols play an ever increasing role in science, engineering and especially in industrial and environmental hygiene. They are being studied since a long time, but only recently the progress in aerosol instrumentation has made it possible to pose of aerosol metrology, especially the problem of absolute measurements, as based directly on measurements of fundamental quantities. On the basis of absolute measurements, the hierarchy of standards can be prepared and adequately disseminated. In the aerosol field, the quantities to be measured are mainly size, charge, density, and shape. In this paper a possible standardisation framework for aerosols is proposed, for the main physical quantities

  8. Metrology for γ-radiation spectrometry in a radiation monitoring system

    Khaikovich, I.M.; Shevrygin, O.N.; Fominykh, V.I.

    1993-01-01

    The rapid measurement of the characteristics of radionuclides is a priority when utilizing nuclear energy because of the needs of environmental conservation. This is particularly the case for long-lived nuclear-fuel fission products, 137,137 Cs, 144 Ce, 60 Co, etc., which as a rule are sources of high-energy γ-radiation. These can be measured by γ-ray spectrometry using scintillation or semiconductor devices. When choosing the metrological models, the starting points are the real characteristics of the distribution of the radionuclides in the soil (rock) and the need to estimate their surface activity and the reserves per unit area, i.e., the parameters from which one can estimate the influence of the radioactivity on nature and can decide the use of land areas. The methodology and the calculations presented show that a single metrological system for radiation monitoring can be constructed using multichannel geophysical radiometers (gamma spectrometers) while relying on a system of initial standard samples of small size. Such a metrological system at present provides all the necessary initial means for measuring the effective γ-radiation surface activity of 137,134 Cs and the mass fraction of the natural radioactive elements. Using these initial means of measurement, surveyed areas in the Leningrad and Tula provinces have been certified as State standard samples in terms of the eight parameters: the surface contamination activity of 137,134 Cs, the reserves of these per unit area, the mass fraction of the natural radioactive elements (potassium, uranium and thorium), the power of the equivalent (exposed) γ-radiation dose at a height of 1 m above the surface. It is intended to use the certified metrological surveyed areas to provide traceability and the required measurement accuracy when studying the contamination in European territories resulting from the accident at the Chernobyl nuclear power station

  9. Research on improved design of airfoil profiles based on the continuity of airfoil surface curvature of wind turbines

    Chen, Jin; Cheng, Jiangtao; Shen, Wenzhong

    2013-01-01

    Aerodynamic of airfoil performance is closely related to the continuity of its surface curvature, and airfoil profiles with a better aerodynamic performance plays an important role in the design of wind turbine. The surface curvature distribution along the chord direction and pressure distributio...

  10. Virtual overlay metrology for fault detection supported with integrated metrology and machine learning

    Lee, Hong-Goo; Schmitt-Weaver, Emil; Kim, Min-Suk; Han, Sang-Jun; Kim, Myoung-Soo; Kwon, Won-Taik; Park, Sung-Ki; Ryan, Kevin; Theeuwes, Thomas; Sun, Kyu-Tae; Lim, Young-Wan; Slotboom, Daan; Kubis, Michael; Staecker, Jens

    2015-03-01

    While semiconductor manufacturing moves toward the 7nm node for logic and 15nm node for memory, an increased emphasis has been placed on reducing the influence known contributors have toward the on product overlay budget. With a machine learning technique known as function approximation, we use a neural network to gain insight to how known contributors, such as those collected with scanner metrology, influence the on product overlay budget. The result is a sufficiently trained function that can approximate overlay for all wafers exposed with the lithography system. As a real world application, inline metrology can be used to measure overlay for a few wafers while using the trained function to approximate overlay vector maps for the entire lot of wafers. With the approximated overlay vector maps for all wafers coming off the track, a process engineer can redirect wafers or lots with overlay signatures outside the standard population to offline metrology for excursion validation. With this added flexibility, engineers will be given more opportunities to catch wafers that need to be reworked, resulting in improved yield. The quality of the derived corrections from measured overlay metrology feedback can be improved using the approximated overlay to trigger, which wafers should or shouldn't be, measured inline. As a development or integration engineer the approximated overlay can be used to gain insight into lots and wafers used for design of experiments (DOE) troubleshooting. In this paper we will present the results of a case study that follows the machine learning function approximation approach to data analysis, with production overlay measured on an inline metrology system at SK hynix.

  11. Analysis and optimization of surface profile correcting mechanism of the pitch lap in large-aperture annular polishing

    Zhang, Huifang; Yang, Minghong; Xu, Xueke; Wu, Lunzhe; Yang, Weiguang; Shao, Jianda

    2017-10-01

    The surface figure control of the conventional annular polishing system is realized ordinarily by the interaction between the conditioner and the lap. The surface profile of the pitch lap corrected by the marble conditioner has been measured and analyzed as a function of kinematics, loading conditions, and polishing time. The surface profile measuring equipment of the large lap based on laser alignment was developed with the accuracy of about 1μm. The conditioning mechanism of the conditioner is simply determined by the kinematics and fully fitting principle, but the unexpected surface profile deviation of the lap emerged frequently due to numerous influencing factors including the geometrical relationship, the pressure distribution at the conditioner/lap interface. Both factors are quantitatively evaluated and described, and have been combined to develop a spatial and temporal model to simulate the surface profile evolution of pitch lap. The simulations are consistent with the experiments. This study is an important step toward deterministic full-aperture annular polishing, providing a beneficial guidance for the surface profile correction of the pitch lap.

  12. Deep sub-wavelength metrology for advanced defect classification

    van der Walle, P.; Kramer, E.; van der Donck, J. C. J.; Mulckhuyse, W.; Nijsten, L.; Bernal Arango, F. A.; de Jong, A.; van Zeijl, E.; Spruit, H. E. T.; van den Berg, J. H.; Nanda, G.; van Langen-Suurling, A. K.; Alkemade, P. F. A.; Pereira, S. F.; Maas, D. J.

    2017-06-01

    Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and classification. For defect detection, TNO has developed the Rapid Nano (RN3) particle scanner, which illuminates the sample from nine azimuth angles. The RN3 is capable of detecting 42 nm Latex Sphere Equivalent (LSE) particles on XXX-flat Silicon wafers. For each sample, the lower detection limit (LDL) can be verified by an analysis of the speckle signal, which originates from the surface roughness of the substrate. In detection-mode (RN3.1), the signal from all illumination angles is added. In review-mode (RN3.9), the signals from all nine arms are recorded individually and analyzed in order to retrieve additional information on the shape and size of deep sub-wavelength defects. This paper presents experimental and modelling results on the extraction of shape information from the RN3.9 multi-azimuth signal such as aspect ratio, skewness, and orientation of test defects. Both modeling and experimental work confirm that the RN3.9 signal contains detailed defect shape information. After review by RN3.9, defects are coarsely classified, yielding a purified Defect-of-Interest (DoI) list for further analysis on slower metrology tools, such as SEM, AFM or HIM, that provide more detailed review data and further classification. Purifying the DoI list via optical metrology with RN3.9 will make inspection time on slower review tools more efficient.

  13. Water surface temperature profiles for the Rhine River derived from Landsat ETM+ data

    Fricke, Katharina; Baschek, Björn

    2013-10-01

    Water temperature influences physical and chemical parameters of rivers and streams and is an important parameter for water quality. It is a crucial factor for the existence and the growth of animal and plant species in the river ecosystem. The aim of the research project "Remote sensing of water surface temperature" at the Federal Institute of Hydrology (BfG), Germany, is to supplement point measurements of water temperature with remote sensing methodology. The research area investigated here is the Upper and Middle Rhine River, where continuous measurements of water temperature are already available for several water quality monitoring stations. Satellite imagery is used to complement these point measurements and to generate longitudinal temperature profiles for a better systematic understanding of the changes in river temperature along its course. Several products for sea surface temperature derived from radiances in the thermal infrared are available, but for water temperature from rivers less research has been carried out. Problems arise from the characteristics of the river valley and morphology and the proximity to the riverbank. Depending on the river width, a certain spatial resolution of the satellite images is necessary to allow for an accurate identification of the river surface and the calculation of water temperature. The bands from the Landsat ETM+ sensor in the thermal infrared region offer a possibility to extract the river surface temperatures (RST) of a sufficiently wide river such as the Rhine. Additionally, problems such as cloud cover, shadowing effects, georeferencing errors, different emissivity of water and land, scattering of thermal radiation, adjacency and mixed pixel effects had to be accounted for and their effects on the radiance temperatures will be discussed. For this purpose, several temperature data sets derived from radiance and in situ measurements were com- pared. The observed radiance temperatures are strongly influenced by

  14. La metrología en nuestras vidas

    Jaramillo, Zaira

    2010-01-01

    A primera vista, la palabra "Metrología" nos trae a la mente la idea de condiciones meteorológicas. Nada más alejado de la realidad, porque la Meteorología es la disciplina que se encarga de estudiar las condiciones del tiempo y la Metrología se encarga de estudiar las mediciones.

  15. National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN

    1992-01-01

    The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs

  16. Differential Evolution for Many-Particle Adaptive Quantum Metrology

    Lovett, N.B.; Crosnier, C.; Perarnau- Llobet, M.; Sanders, B.

    2013-01-01

    We devise powerful algorithms based on differential evolution for adaptive many-particle quantum metrology. Our new approach delivers adaptive quantum metrology policies for feedback control that are orders-of-magnitude more efficient and surpass the few-dozen-particle limitation arising in methods

  17. Consultative committee on ionizing radiation: Impact on radionuclide metrology

    Karam, L.R.; Ratel, G.

    2016-01-01

    In response to the CIPM MRA, and to improve radioactivity measurements in the face of advancing technologies, the CIPM's consultative committee on ionizing radiation developed a strategic approach to the realization and validation of measurement traceability for radionuclide metrology. As a consequence, measurement institutions throughout the world have devoted no small effort to establish radionuclide metrology capabilities, supported by active quality management systems and validated through prioritized participation in international comparisons, providing a varied stakeholder community with measurement confidence. - Highlights: • Influence of CIPM MRA on radionuclide metrology at laboratories around the world. • CCRI strategy: to be the “undisputed hub for ionizing radiation global metrology.” • CCRI Strategic Plan stresses importance of measurement confidence for stakeholder. • NMIs increasing role in radionuclide metrology by designating institutions (DIs). • NMIs and DIs establish quality systems; validate capabilities through comparisons.

  18. High pressure metrology for industrial applications

    Sabuga, Wladimir; Rabault, Thierry; Wüthrich, Christian; Pražák, Dominik; Chytil, Miroslav; Brouwer, Ludwig; Ahmed, Ahmed D. S.

    2017-12-01

    To meet the needs of industries using high pressure technologies, in traceable, reliable and accurate pressure measurements, a joint research project of the five national metrology institutes and the university was carried out within the European Metrology Research Programme. In particular, finite element methods were established for stress-strain analysis of elastic and nonlinear elastic-plastic deformation, as well as of contact processes in pressure-measuring piston-cylinder assemblies, and high-pressure components at pressures above 1 GPa. New pressure measuring multipliers were developed and characterised, which allow realisation of the pressure scale up to 1.6 GPa. This characterisation is based on research including measurements of material elastic constants by the resonant ultrasound spectroscopy, hardness of materials of high pressure components, density and viscosity of pressure transmitting liquids at pressures up to 1.4 GPa and dimensional measurements on piston-cylinders. A 1.6 GPa pressure system was created for operation of the 1.6 GPa multipliers and calibration of high pressure transducers. A transfer standard for 1.5 GPa pressure range, based on pressure transducers, was built and tested. Herewith, the project developed the capability of measuring pressures up to 1.6 GPa, from which industrial users can calibrate their pressure measurement devices for accurate measurements up to 1.5 GPa.

  19. Optics for Processes, Products and Metrology

    Mather, George

    1999-04-01

    Optical physics has a variety of applications in industry, including process inspection, coatings development, vision instrumentation, spectroscopy, and many others. Optics has been used extensively in the design of solar energy collection systems and coatings, for example. Also, with the availability of good CCD cameras and fast computers, it has become possible to develop real-time inspection and metrology devices that can accommodate the high throughputs encountered in modern production processes. More recently, developments in moiré interferometry show great promise for applications in the basic metals and electronics industries. The talk will illustrate applications of optics by discussing process inspection techniques for defect detection, part dimensioning, birefringence measurement, and the analysis of optical coatings in the automotive, glass, and optical disc industries. In particular, examples of optical techniques for the quality control of CD-R, MO, and CD-RW discs will be presented. In addition, the application of optical concepts to solar energy collector design and to metrology by moiré techniques will be discussed. Finally, some of the modern techniques and instruments used for qualitative and quantitative material analysis will be presented.

  20. A metrology solution for the orthopaedic industry

    Bills, P; Brown, L; Jiang, X; Blunt, L

    2005-01-01

    Total joint replacement is one of the most common elective surgical procedures performed worldwide, with an estimate of 1.5 million operations performed annually. Currently joint replacements are expected to function for 10-15 years, however, with an increase in life expectancy, and a greater call for knee replacement due to increased activity levels, there is a requirement to improve their function to offer longer term improved quality of life for patients. The amount of wear that a joint incurs is seen as a good indicator of performance, with higher wear rates typically leading to reduced function and premature failure. New technologies and materials are pushing traditional wear assessment methods to their limits, and novel metrology solutions are required to assess wear of joints following in vivo and in vitro use. This paper presents one such measurement technique; a scanning co-ordinate metrology machine for geometrical assessment. A case study is presented to show the application of this technology to a real orthopaedic measurement problem: the wear of components in total knee replacement. This technique shows good results and provides a basis for further developing techniques for geometrical wear assessment of total joint replacements

  1. Metrological challenges introduced by new tolerancing standards

    Morse, Edward; Peng, Yue; Srinivasan, Vijay; Shakarji, Craig

    2014-01-01

    The recent release of ISO 14405-1 has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity. However, these tools also bring new challenges and pitfalls to an inspector using a coordinate metrology system. A sampling strategy that might have worked well in the past could lead to erroneous results that go undetected when used to evaluate these new specifications. In this paper we investigate how measurement strategies for sampled coordinate metrology systems influence different algorithms for the evaluation of these new specifications. Of particular interest are those specifications where the order statistics of feature cross-sections are required. Here the inspector must decide not only how many points are required for an individual cross-section, but the number and spacing of cross-sections measured on the feature. The results of these decisions are compared with an analytic estimate of the ‘true value’ of the measurand specified using this new standard. (paper)

  2. Regional metrology organisations and the JCRB

    Hetherington, Paul

    2004-01-01

    In 1999, National Metrology Institutes (NMIs) from some 39 countries signed the International Committee of Weights and Measures (CIPM) Mutual Recognition Arrangement (MRA) in Paris. The MRA, drawn up by the CIPM, under the authority given to it in the Metre Convention, was in response to requirements of Governments and Regulators to provide a sound technical foundation for trade agreements. Core objectives of the MRA are to allow for the establishment of the degree of equivalence of national measurement standards and to provide for mutual recognition of calibration certificates issued by NMIs. This presentation will detail the evolution of the MRA. Globally, NMIs are affiliated to Regional Metrology Organisations (RMOs). The key role of the RMOs in the MRA process will be discussed along with the structure and objectives of the various RMOs worldwide. The Joint Committee of the RMOs and the BIPM (JCRB) plays a central part in the effective operation of the MRA. Its tasks, membership and output will also be described

  3. Strong orientation dependence of surface mass density profiles of dark haloes at large scales

    Osato, Ken; Nishimichi, Takahiro; Oguri, Masamune; Takada, Masahiro; Okumura, Teppei

    2018-06-01

    We study the dependence of surface mass density profiles, which can be directly measured by weak gravitational lensing, on the orientation of haloes with respect to the line-of-sight direction, using a suite of N-body simulations. We find that, when major axes of haloes are aligned with the line-of-sight direction, surface mass density profiles have higher amplitudes than those averaged over all halo orientations, over all scales from 0.1 to 100 Mpc h-1 we studied. While the orientation dependence at small scales is ascribed to the halo triaxiality, our results indicate even stronger orientation dependence in the so-called two-halo regime, up to 100 Mpc h-1. The orientation dependence for the two-halo term is well approximated by a multiplicative shift of the amplitude and therefore a shift in the halo bias parameter value. The halo bias from the two-halo term can be overestimated or underestimated by up to {˜ } 30 per cent depending on the viewing angle, which translates into the bias in estimated halo masses by up to a factor of 2 from halo bias measurements. The orientation dependence at large scales originates from the anisotropic halo-matter correlation function, which has an elliptical shape with the axis ratio of ˜0.55 up to 100 Mpc h-1. We discuss potential impacts of halo orientation bias on other observables such as optically selected cluster samples and a clustering analysis of large-scale structure tracers such as quasars.

  4. From the chlorophyll a in the surface layer to its vertical profile: a Greenland Sea relationship for satellite applications

    A. Cherkasheva

    2013-04-01

    Full Text Available Current estimates of global marine primary production range over a factor of two. Improving these estimates requires an accurate knowledge of the chlorophyll vertical profiles, since they are the basis for most primary production models. At high latitudes, the uncertainty in primary production estimates is larger than globally, because here phytoplankton absorption shows specific characteristics due to the low-light adaptation, and in situ data and ocean colour observations are scarce. To date, studies describing the typical chlorophyll profile based on the chlorophyll in the surface layer have not included the Arctic region, or, if it was included, the dependence of the profile shape on surface concentration was neglected. The goal of our study was to derive and describe the typical Greenland Sea chlorophyll profiles, categorized according to the chlorophyll concentration in the surface layer and further monthly resolved profiles. The Greenland Sea was chosen because it is known to be one of the most productive regions of the Arctic and is among the regions in the Arctic where most chlorophyll field data are available. Our database contained 1199 chlorophyll profiles from R/Vs Polarstern and Maria S. Merian cruises combined with data from the ARCSS-PP database (Arctic primary production in situ database for the years 1957–2010. The profiles were categorized according to their mean concentration in the surface layer, and then monthly median profiles within each category were calculated. The category with the surface layer chlorophyll (CHL exceeding 0.7 mg C m−3 showed values gradually decreasing from April to August. A similar seasonal pattern was observed when monthly profiles were averaged over all the surface CHL concentrations. The maxima of all chlorophyll profiles moved from the greater depths to the surface from spring to late summer respectively. The profiles with the smallest surface values always showed a subsurface chlorophyll

  5. The Surface Density Profile of the Galactic Disk from the Terminal Velocity Curve

    McGaugh, Stacy S.

    2016-01-01

    The mass distribution of the Galactic disk is constructed from the terminal velocity curve and the mass discrepancy-acceleration relation. Mass models numerically quantifying the detailed surface density profiles are tabulated. For R0 = 8 kpc, the models have stellar mass 5 spiral galaxy that obeys scaling relations like the Tully-Fisher relation, the size-mass relation, and the disk maximality-surface brightness relation. The stellar disk is maximal, and the spiral arms are massive. The bumps and wiggles in the terminal velocity curve correspond to known spiral features (e.g., the Centaurus arm is a ˜50% overdensity). The rotation curve switches between positive and negative over scales of hundreds of parsecs. The rms amplitude { }1/2≈ 14 {km} {{{s}}}-1 {{kpc}}-1, implying that commonly neglected terms in the Jeans equations may be nonnegligible. The spherically averaged local dark matter density is ρ0,DM ≈ 0.009 {M}⊙ {{pc}}-3 (0.34 {GeV} {{cm}}-3). Adiabatic compression of the dark matter halo may help reconcile the Milky Way with the c-V200 relation expected in ΛCDM while also helping to mitigate the too-big-to-fail problem, but it remains difficult to reconcile the inner bulge/bar-dominated region with a cuspy halo. We note that NGC 3521 is a near twin to the Milky Way, having a similar luminosity, scale length, and rotation curve.

  6. Retrieving 4-dimensional atmospheric boundary layer structure from surface observations and profiles over a single station

    Pu, Zhaoxia [Univ. of Utah, Salt Lake City, UT (United States)

    2015-10-06

    Most routine measurements from climate study facilities, such as the Department of Energy’s ARM SGP site, come from individual sites over a long period of time. While single-station data are very useful for many studies, it is challenging to obtain 3-dimensional spatial structures of atmospheric boundary layers that include prominent signatures of deep convection from these data. The principal objective of this project is to create realistic estimates of high-resolution (~ 1km × 1km horizontal grids) atmospheric boundary layer structure and the characteristics of precipitating convection. These characteristics include updraft and downdraft cumulus mass fluxes and cold pool properties over a region the size of a GCM grid column from analyses that assimilate surface mesonet observations of wind, temperature, and water vapor mixing ratio and available profiling data from single or multiple surface stations. The ultimate goal of the project is to enhance our understanding of the properties of mesoscale convective systems and also to improve their representation in analysis and numerical simulations. During the proposed period (09/15/2011–09/14/2014) and the no-cost extension period (09/15/2014–09/14/2015), significant accomplishments have been achieved relating to the stated goals. Efforts have been extended to various research and applications. Results have been published in professional journals and presented in related science team meetings and conferences. These are summarized in the report.

  7. Wideband, Low-Profile, Dual-Polarized Slot Antenna with an AMC Surface for Wireless Communications

    Wei Hu

    2016-01-01

    Full Text Available A wideband dual-polarized slot antenna loaded with artificial magnetic conductor (AMC is proposed for WLAN/WIMAX and LTE applications. The slot antenna mainly consists of two pairs of arrow-shaped slots along the diagonals of the square patch. Stepped microstrip feedlines are placed orthogonally to excite the horizontal and vertical polarizations of the antenna. To realize unidirectional radiation and low profile, an AMC surface composed of 7 × 7 unit cells is designed underneath a distance of 0.09λ0 (λ0 being the wavelength in free space at 2.25 GHz from the slot antenna. Both the dual-polarized slot antenna and the AMC surface are fabricated and measured. Experimental results demonstrate that the proposed antenna achieves for both polarizations a wide impedance bandwidth (return loss 10 dB of 36.7%, operating from 1.96 to 2.84 GHz. The isolation between the two input ports keeps higher than 29 dB whereas the cross-polarization levels basically maintain lower than −30 dB across the entire frequency band. High front-to-back ratios better than 22 dB and a stable gain higher than 8 dBi are obtained over the whole band.

  8. Advanced applications of scatterometry based optical metrology

    Dixit, Dhairya; Keller, Nick; Kagalwala, Taher; Recchia, Fiona; Lifshitz, Yevgeny; Elia, Alexander; Todi, Vinit; Fronheiser, Jody; Vaid, Alok

    2017-03-01

    The semiconductor industry continues to drive patterning solutions that enable devices with higher memory storage capacity, faster computing performance, and lower cost per transistor. These developments in the field of semiconductor manufacturing along with the overall minimization of the size of transistors require continuous development of metrology tools used for characterization of these complex 3D device architectures. Optical scatterometry or optical critical dimension (OCD) is one of the most prevalent inline metrology techniques in semiconductor manufacturing because it is a quick, precise and non-destructive metrology technique. However, at present OCD is predominantly used to measure the feature dimensions such as line-width, height, side-wall angle, etc. of the patterned nano structures. Use of optical scatterometry for characterizing defects such as pitch-walking, overlay, line edge roughness, etc. is fairly limited. Inspection of process induced abnormalities is a fundamental part of process yield improvement. It provides process engineers with important information about process errors, and consequently helps optimize materials and process parameters. Scatterometry is an averaging technique and extending it to measure the position of local process induced defectivity and feature-to-feature variation is extremely challenging. This report is an overview of applications and benefits of using optical scatterometry for characterizing defects such as pitch-walking, overlay and fin bending for advanced technology nodes beyond 7nm. Currently, the optical scatterometry is based on conventional spectroscopic ellipsometry and spectroscopic reflectometry measurements, but generalized ellipsometry or Mueller matrix spectroscopic ellipsometry data provides important, additional information about complex structures that exhibit anisotropy and depolarization effects. In addition the symmetry-antisymmetry properties associated with Mueller matrix (MM) elements

  9. Analysis of key technologies for virtual instruments metrology

    Liu, Guixiong; Xu, Qingui; Gao, Furong; Guan, Qiuju; Fang, Qiang

    2008-12-01

    Virtual instruments (VIs) require metrological verification when applied as measuring instruments. Owing to the software-centered architecture, metrological evaluation of VIs includes two aspects: measurement functions and software characteristics. Complexity of software imposes difficulties on metrological testing of VIs. Key approaches and technologies for metrology evaluation of virtual instruments are investigated and analyzed in this paper. The principal issue is evaluation of measurement uncertainty. The nature and regularity of measurement uncertainty caused by software and algorithms can be evaluated by modeling, simulation, analysis, testing and statistics with support of powerful computing capability of PC. Another concern is evaluation of software features like correctness, reliability, stability, security and real-time of VIs. Technologies from software engineering, software testing and computer security domain can be used for these purposes. For example, a variety of black-box testing, white-box testing and modeling approaches can be used to evaluate the reliability of modules, components, applications and the whole VI software. The security of a VI can be assessed by methods like vulnerability scanning and penetration analysis. In order to facilitate metrology institutions to perform metrological verification of VIs efficiently, an automatic metrological tool for the above validation is essential. Based on technologies of numerical simulation, software testing and system benchmarking, a framework for the automatic tool is proposed in this paper. Investigation on implementation of existing automatic tools that perform calculation of measurement uncertainty, software testing and security assessment demonstrates the feasibility of the automatic framework advanced.

  10. Metrology for WEST components design and integration optimization

    Brun, C.; Archambeau, G.; Blanc, L.; Bucalossi, J.; Chantant, M.; Gargiulo, L.; Hermenier, A.; Le, R.; Pilia, A.

    2015-01-01

    Highlights: • Metrology methods. • Interests of metrology campaign to optimize margins by reducing uncertainties. • Assembly problems are solved and validated on a numerical mock up. • Post treatment of full 3DScan of the vacuum vessel. - Abstract: On WEST new components will be implemented in an existing environment, emphasis has to be put on the metrology to optimize the design and the assembly. Hence, at a particular stage of the project, several components have to coexist in the limited vessel. Therefore, all the difficulty consists in validating the mechanical interfaces between existing components and new one; minimize the risk of the assembling and to maximize the plasma volume. The CEA/IRFM takes the opportunity of the ambitious project to sign a partnership with an industrial specialized in multipurpose metrology domains. To optimize the assembly procedure, the IRFM Assembly group works in strong collaboration with its industrial, to define and plan the campaigns of metrology. The paper will illustrate the organization, methods and results of the dedicated metrology campaigns have been defined and carried out in the WEST dis/assembly phase. To conclude, the future needs of metrology at CEA/IRFM will be exposed to define the next steps.

  11. Self-consistent electronic structure and segregation profiles of the Cu-Ni (001) random-alloy surface

    Ruban, Andrei; Abrikosov, I. A.; Kats, D. Ya.

    1994-01-01

    We have calculated the electronic structure and segregation profiles of the (001) surface of random Cu-Ni alloys with varying bulk concentrations by means of the coherent potential approximation and the linear muffin-tin-orbitals method. Exchange and correlation were included within the local......-density approximation. Temperature effects were accounted for by means of the cluster-variation method and, for comparison, by mean-field theory. The necessary interaction parameters were calculated by the Connolly-Williams method generalized to the case of a surface of a random alloy. We find the segregation profiles...

  12. Metrology network: a case study on the metrology network of defense and security from SIBRATEC

    Pereira, Marisa Ferraz Figueira

    2016-01-01

    This study is focused on understanding the effects of the infrastructure improvement of these laboratories and the role of network management in offering support and metrological services to the defense and security sector enterprises, within the project purposes. It is also aimed identify gaps on offering calibration and, or testing services to supply demands of the defense and security industries, and analyze adequacy of RDS project to demands of defense and security industries, with the purpose to contribute with information for future actions. The experimental research is qualitative type, with exploratory research characteristics, based on case study. It was structured in two parts, involving primary data collection and secondary data. In order to collect the primary data two questionnaires were prepared, one (Questionnaire A) to the five RDS laboratories representatives and other (Questionnaire B) to the contacts of 63 defense and security enterprises which need calibration and test services, possible customers of RDS laboratories. Answers from four representatives of RDS laboratories and from 26 defense and security enterprises were obtained. The collection of secondary data was obtained from documentary research. The analysis was made based on five dimensions defined in order to organize and improve the understanding of the research setting. They are RDS project coverage, regional, network management, metrological traceability and importance and visibility of RDS. The results indicated that the performance of RDS does not interfere, by that time, in the metrological traceability of the products of the defense and security enterprises that participated in the research. (author)

  13. Radionuclide metrology research for nuclear site decommissioning

    Judge, S. M.; Regan, P. H.

    2017-11-01

    The safe and cost-effective decommissioning of legacy nuclear sites relies on accurate measurement of the radioactivity content of the waste materials, so that the waste can be assigned to the most appropriate disposal route. Such measurements are a new challenge for the science of radionuclide metrology which was established largely to support routine measurements on operating nuclear sites and other applications such as nuclear medicine. In this paper, we provide a brief summary of the international measurement system that is established to enable nuclear site operators to demonstrate that measurements are accurate, independent and fit for purpose, and highlight some of the projects that are underway to adapt the measurement system to meet the changing demands from the industry.

  14. Plant equipment services with laser metrology

    Hayes, J.H.; Kreitman, P.J.

    1995-01-01

    A new industrial metrology process is now being applied to support PWR Nuclear Plant Steam Generator Replacement Projects. The method uses laser tracking interferometry to perform as built surveys of existing and replacement plant equipment. This method provides precision data with a minimum of setup when compared to alternative methods available. In addition there is no post processing required to ascertain validity. The data is obtained quickly, processed in real time and displayed during the survey in the desired coordinate system. These capabilities make this method of industrial measure ideal for various data acquisition needs throughout the power industry, from internal/external equipment templating to area mapping. Laser tracking interferometry is an improvement on the present use of optical instruments and surveying technique. In order to describe the laser tracking interferometry measurement process, previous methods of templating and surveying are first reviewed

  15. Coordinate metrology accuracy of systems and measurements

    Sładek, Jerzy A

    2016-01-01

    This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book...

  16. Ionising radiation metrology for the metallurgical industry

    García-Toraño E.

    2014-01-01

    Full Text Available Every year millions tons of steel are produced worldwide from recycled scrap loads. Although the detection systems in the steelworks prevent most orphan radioactive sources from entering the furnace, there is still the possibility of accidentally melting a radioactive source. The MetroMetal project, carried out in the frame of the European Metrology Research Programme (EMRP, addresses this problem by studying the existing measurement systems, developing sets of reference sources in various matrices (cast steel, slag, fume dust and proposing new detection instruments. This paper presents the key lines of the project and describes the preparation of radioactive sources as well as the intercomparison exercises used to test the calibration and correction methods proposed within the project.

  17. X-ray metrology for ULSI structures

    Bowen, D. K.; Matney, K. M.; Wormington, M.

    1998-01-01

    Non-destructive X-ray metrological methods are discussed for application to both process development and process control of ULSI structures. X-ray methods can (a) detect the unacceptable levels of internal defects generated by RTA processes in large wafers, (b) accurately measure the thickness and roughness of layers between 1 and 1000 nm thick and (c) can monitor parameters such as crystallographic texture and the roughness of buried interfaces. In this paper we review transmission X-ray topography, thin film texture measurement, grazing-incidence X-ray reflectivity and high-resolution X-ray diffraction. We discuss in particular their suitability as on-line sensors for process control

  18. An augmented space recursive method for the first principles study of concentration profiles at CuNi alloy surfaces

    Dasgupta, I.; Mookerjee, A.

    1995-07-01

    We present here a first principle method for the calculation of effective cluster interactions for semi-infinite solid alloys required for the study of surface segregation and surface ordering on disordered surfaces. Our method is based on the augmented space recursion coupled with the orbital peeling method of Burke in the framework of the TB-LMTO. Our study of surface segregation in CuNi alloys demonstrates strong copper segregation and a monotonic concentration profile throughout the concentration range. (author). 35 refs, 4 figs, 2 tabs

  19. Plutonium glove boxes - metrology and operational states

    Thyer, A.M.

    2001-01-01

    The main objective was to undertake a literature review in support of NII's ongoing work in improving safety in the nuclear industry to help define suitable standards of cleanliness for plutonium glove boxes. This is to cover the following areas: existing or proposed national/international standards relating to plutonium glove box cleanliness management; practicable metrology options for assessing the plutonium content of glove boxes; any available dose information relating to the operation of modern and 'old design'; current contamination levels of specific significance (i.e. any accepted level in decommissioning/waste terms, typical criticality limits (if available), any box plutonium loadings that are documented with corresponding operator doses etc.); and, techniques for the decontamination of plutonium glove boxes and their relative effectiveness. This should then form the basis of any further development work undertaken by the UK nuclear industry. Main recommendations are as follows: 1) No information could be found in open literature on acceptable levels of contamination in boxes and action levels for cleanup. If these are not available in closed publications the 2) Where possible, the decontamination methods identified should be tested and dose information recorded against each method to allow informed decisions on which is the optimum technique for a particular form of contamination. 3) Consideration should be given to utilisation of metrology options which have the lowest potential for exposure of operators. Preferred options, may be detection from the outside of boxes using hand-held or permanently located radiation detectors, or semi-intrusive methods such as air-ionisation readings which would require one-off installation of detectors in ductwork

  20. Trapped atomic ions for quantum-limited metrology

    Wineland, David

    2017-04-01

    Laser-beam-manipulated trapped ions are a candidate for large-scale quantum information processing and quantum simulation but the basic techniques used can also be applied to quantum-limited metrology and sensing. Some examples being explored at NIST are: 1) As charged harmonic oscillators, trapped ions can be used to sense electric fields; this can be used to characterize the electrode-surface-based noisy electric fields that compromise logic-gate fidelities and may eventually be used as a tool in surface science. 2) Since typical qubit logic gates depend on state-dependent forces, we can adapt the gate dynamics to sensitively detect additional forces. 3) We can use extensions of Bell inequality measurements to further restrict the degree of local realism possessed by Bell states. 4) We also briefly describe experiments for creation of Bell states using Hilbert space engineering. This work is a joint effort including the Ion-Storage group, the Quantum processing group, and the Computing and Communications Theory group at NIST, Boulder. Supported by IARPA, ONR, and the NIST Quantum Information Program.

  1. Periodontal Bioengineering: A Discourse in Surface Topographies, Progenitor Cells and Molecular Profiles

    Dangaria, Smit J.

    2011-12-01

    Stem/progenitor cells are a population of cells capable of providing replacement cells for a given differentiated cell type. We have applied progenitor cell-based technologies to generate novel tissue-engineered implants that use biomimetic strategies with the ultimate goal of achieving full regeneration of lost periodontal tissues. Mesenchymal periodontal tissues such as cementum, alveolar bone (AB), and periodontal ligament (PDL) are neural crest-derived entities that emerge from the dental follicle (DF) at the onset of tooth root formation. Using a systems biology approach we have identified key differences between these periodontal progenitors on the basis of global gene expression profiles, gene cohort expression levels, and epigenetic modifications, in addition to differences in cellular morphologies. On an epigenetic level, DF progenitors featured high levels of the euchromatin marker H3K4me3, whereas PDL cells, AB osteoblasts, and cementoblasts contained high levels of the transcriptional repressor H3K9me3. Secondly, we have tested the influence of natural extracellular hydroxyapatite matrices on periodontal progenitor differentiation. Dimension and structure of extracellular matrix surfaces have powerful influences on cell shape, adhesion, and gene expression. Here we show that natural tooth root topographies induce integrin-mediated extracellular matrix signaling cascades in tandem with cell elongation and polarization to generate physiological periodontium-like tissues. In this study we replanted surface topography instructed periodontal ligament progenitors (PDLPs) into rat alveolar bone sockets for 8 and 16 weeks, resulting in complete attachment of tooth roots to the surrounding alveolar bone with a periodontal ligament fiber apparatus closely matching physiological controls along the entire root surface. Displacement studies and biochemical analyses confirmed that progenitor-based engineered periodontal tissues were similar to control teeth and

  2. In-Situ Observation of Undisturbed Surface Layer Scaler Profiles for Characterizing Evaporative Duct Properties

    2016-06-01

    9 Figure 4. Prototype RHIB-based tethered balloon MAPS used in CASPER Pilot. The...profile measurements over the ocean. The system is designed to make profiling measurements with multiple up/downs using an instrumented tethered balloon ...temperature profiles with high vertical resolution. With the ultimate goal of improving evaporative duct prediction, we use a tethered 2 balloon

  3. Performance-based gear metrology kinematic, transmission, error computation and diagnosis

    Mark, William D

    2012-01-01

    A mathematically rigorous explanation of how manufacturing deviations and damage on the working surfaces of gear teeth cause transmission-error contributions to vibration excitations Some gear-tooth working-surface manufacturing deviations of significant amplitude cause negligible vibration excitation and noise, yet others of minuscule amplitude are a source of significant vibration excitation and noise.   Presently available computer-numerically-controlled dedicated gear metrology equipment can measure such error patterns on a gear in a few hours in sufficient detail to enable

  4. Sclero-topometry Metrology in Valorisation of Waste Oil for Micro-machining of Ductile Cast Iron

    Eymard S.

    2013-12-01

    Full Text Available During the time, the specific characteristics and the efficient lifetime of oil progressively decrease, due to complex pollution, ultimately making the oil unsuitable for the initial applications. The strategy to regenerate and to valorise waste oils is investigated using improved combinations of sclerometric and topometric tests on ductile nodular cast iron. Tribo-abrasive tests are performed in critical conditions, with base oil, waste oil and regenerated oil, of similar viscosities in order to discriminate their interfacial performances. The forms of the scratch traces indicate wear resistance and tendency to elasto-plastic deformation. The mechanisms of deformation and frictional behaviours were evaluated using optical and Scanning Electron Microscopy and measured for various tribological conditions with tactile and optical profilometry. The Energy Dispersive X ray Spectroscopy completes the chemical superficial distribution of pertinent elements. The surface topography metrology is used to characterize the scratch profiles and to determine the volume of the displaced and removed material, as well as maximum pit height. The originality of this paper is that it is a unique approach specifically devoted to transformer oil concerning tribological conditions.

  5. Metrology for environment and climate; Metrologie fuer Umwelt und Klima

    Sommer, Klaus-Dieter [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany). Abt. ' Chemische Physik und Explosionsschutz' ; Spitzer, Petra [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany). Arbeitsgruppe ' Elektrochemie'

    2012-12-15

    The author describes the observation and monitoring systems developed by the EU and the Federal Republic of Germany. In this connection the metrological aims are described in connection with the activities of the PTB. (HSI)

  6. Joint Research on Scatterometry and AFM Wafer Metrology

    Bodermann, B.; Buhr, E.; Danzebrink, H.U.; Bär, M.; Scholze, F.; Krumrey, M.; Wurm, M.; Klapetek, P.; Hansen, P.E.; Korpelainen, V.; Van Veghel, M.; Yacoot, A.; Siitonen, S.; El Gawhary, O.; Burger, S.

    2011-01-01

    Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both experimental and modelling methods will be enhanced and different methods will be compared with each other and with specially adapted atomic force microscopy (AFM) and scanning electron microscopy (SEM) m...

  7. Metrology of radiation protection. Pt. 1. Physical requirements and terminology

    Wagner, S R

    1979-10-01

    Starting from a general consideration of the needs for radiation protection the physical requirements of a relevant metrology are developed. The expedient physical quantities are introduced and problems in the realization and dissemination of their units discussed. It is shown that owing to these difficulties, derived or operational quantities have to be developed for the construction and calibration of practical measuring instruments. Finally the relations between the metrology of radiation protection and of medical radiology are pointed out and commented. (orig.).

  8. Optical vortex metrology for non-destructive testing

    Wang, W.; Hanson, Steen Grüner

    2009-01-01

    Based on the phase singularities in optical fields, we introduce a new technique, referred to as Optical Vortex Metrology, and demonstrate its application to nano- displacement, flow measurements and biological kinematic analysis.......Based on the phase singularities in optical fields, we introduce a new technique, referred to as Optical Vortex Metrology, and demonstrate its application to nano- displacement, flow measurements and biological kinematic analysis....

  9. Metrology in electricity and magnetism: EURAMET activities today and tomorrow

    Piquemal, F.; Jeckelmann, B.; Callegaro, L.; Hällström, J.; Janssen, T. J. B. M.; Melcher, J.; Rietveld, G.; Siegner, U.; Wright, P.; Zeier, M.

    2017-10-01

    Metrology dedicated to electricity and magnetism has changed considerably in recent years. It encompasses almost all modern scientific, industrial, and societal challenges, e.g. the revision of the International System of Units, the profound transformation of industry, changes in energy use and generation, health, and environment, as well as nanotechnologies (including graphene and 2D materials) and quantum engineering. Over the same period, driven by the globalization of worldwide trade, the Mutual Recognition Arrangement (referred to as the CIPM MRA) was set up. As a result, the regional metrology organizations (RMOs) of national metrology institutes have grown in significance. EURAMET is the European RMO and has been very prominent in developing a strategic research agenda (SRA) and has established a comprehensive research programme. This paper reviews the highlights of EURAMET in electrical metrology within the European Metrology Research Programme and its main contributions to the CIPM MRA. In 2012 EURAMET undertook an extensive roadmapping exercise for proposed activities for the next decade which will also be discussed in this paper. This work has resulted in a new SRA of the second largest European funding programme: European Metrology Programme for Innovation and Research.

  10. A primary mirror metrology system for the GMT

    Rakich, A.

    2016-07-01

    The Giant Magellan Telescope (GMT)1 is a 25 m "doubly segmented" telescope composed of seven 8.4 m "unit Gregorian telescopes", on a common mount. Each primary and secondary mirror segment will ideally lie on the geometrical surface of the corresponding rotationally symmetrical full aperture optical element. Therefore, each primary and conjugated secondary mirror segment will feed a common instrument interface, their focal planes co-aligned and cophased. First light with a subset of four unit telescopes is currently scheduled for 2022. The project is currently considering an important aspect of the assembly, integration and verification (AIV) phase of the project. This paper will discuss a dedicated system to directly characterize the on-sky performance of the M1 segments, independently of the M2 subsystem. A Primary Mirror Metrology System (PMS) is proposed. The main purpose of this system will be to he4lp determine the rotation axis of an instrument rotator (the Gregorian Instrument Rotator or GIR in this case) and then to characterize the deflections and deformations of the M1 segments with respect to this axis as a function of gravity and temperature. The metrology system will incorporate a small (180 mm diameter largest element) prime focus corrector (PFC) that simultaneously feeds a risk reduction during AIV; it allows an on-sky characterization of the primary mirror segments and cells, without the complications of other optical elements. The PMS enables a very useful alignment strategy that constrains each primary mirror segments' optical axes to follow the GIR axis to within a few arc seconds. An additional attractive feature of the incorporation of the PMS into the AIV plan, is that it allows first on-sky telescope operations to occur with a system of considerably less optical and control complexity than the final doubly segmented Gregorian telescope configuration. This paper first discusses the strategic rationale for a PMS. Next the system itself is

  11. Some answers to new challenges in optical metrology

    Osten, W.

    2008-09-01

    The visible trend in the implementation of new technologies and creation of new products is the continuous reduction of feature sizes. However, in the same way as the feature sizes are decreasing, the theoretical and practical constraints of making them and ensuring their quality are increasing. Consequently, modern production and inspection technologies are confronted with a bundle of challenges. An important barrier for optical imaging and sensing is the diffraction limited lateral resolution. The observation of this physical limitation is of increasing importance, not only for microscopic techniques but also for the application of 3D-measurement techniques on wafer scale level. A further challenge is the reliable detection of imperfections and material faults within the production chain. This means in-line metrology/defectoscopy is a must for future production systems. Only the real-time feedback of the inspection results into the production process can contribute to a consistent quality assurance in processes with high cost risk. Moreover the reliable measurement of free form surfaces, both technical and optical, the assurance of the traceability and the certified assessment of the uncertainty of the measurement results are ongoing challenges. The challenges and the physical limitations are addressed here by new approaches for testing semiconductor structures with enhanced resolution, the measurement of aspheric lenses with increased flexibility and the inspection of micro components with improved traceability.

  12. Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

    Steinberger, R., E-mail: roland.steinberger@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Celedón, C.E., E-mail: carlos.celedon@usm.cl [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Departamento de Física, Universidad Técnica Federico Santa María, Valaparaíso, Casilla 110-V (Chile); Bruckner, B., E-mail: barbara.bruckner@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Roth, D., E-mail: dietmar.roth@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Duchoslav, J., E-mail: jiri.duchoslav@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Arndt, M., E-mail: martin.arndt@voestalpine.com [voestalpine Stahl GmbH, voestalpine-Straße 3, 4031 Linz (Austria); Kürnsteiner, P., E-mail: p.kuernsteiner@mpie.de [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); and others

    2017-07-31

    Highlights: • Investigation on the impact of residual gas prevailing in UHV chambers. • For some metals detrimental oxygen uptake could be observed within shortest time. • Totally different behavior was found: no changes, solely adsorption and oxidation. • The UHV residual gas may severely corrupt results obtained from depth profiling. • A well-considered data acquisition sequence is the key for reliable depth profiles. - Abstract: Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

  13. THE INITIAL MASS FUNCTION AND THE SURFACE DENSITY PROFILE OF NGC 6231

    Sung, Hwankyung [Department of Astronomy and Space Science, Sejong University, 98, Kunja-dong, Kwangjin-gu, Seoul 143-747 (Korea, Republic of); Sana, Hugues [Astronomical Institute ' Anton Pannekeok' , Amsterdam University, Science Park 904, 1098-XH Amsterdam (Netherlands); Bessell, Michael S., E-mail: sungh@sejong.ac.kr, E-mail: H.Sana@uva.nl, E-mail: bessell@mso.anu.edu.au [Research School of Astronomy and Astrophysics, Australian National University, MSO, Cotter Road, Weston, ACT 2611 (Australia)

    2013-02-01

    We have performed new wide-field photometry of the young open cluster NGC 6231 to study the shape of the initial mass function (IMF) and mass segregation. We also investigated the reddening law toward NGC 6231 from optical to mid-infrared color excess ratios, and found that the total-to-selective extinction ratio is R{sub V} = 3.2, which is very close to the normal value. But many early-type stars in the cluster center show large color excess ratios. We derived the surface density profiles of four member groups, and found that they reach the surface density of field stars at about 10', regardless of stellar mass. The IMF of NGC 6231 is derived for the mass range 0.8-45 M{sub Sun }. The slope of the IMF of NGC 6231 ({Gamma} = -1.1 {+-} 0.1) is slightly shallower than the canonical value, but the difference is marginal. In addition, the mass function varies systematically, and is a strong function of radius-it is very shallow at the center, and very steep at the outer ring suggesting the cluster is mass segregated. We confirm the mass segregation for the massive stars (m {approx}> 8 M{sub Sun }) by a minimum spanning tree analysis. Using a Monte Carlo method, we estimate the total mass of NGC 6231 to be about 2.6 ({+-} 0.6) Multiplication-Sign 10{sup 3} M{sub Sun }. We constrain the age of NGC 6231 by comparison with evolutionary isochrones. The age of the low-mass stars ranges from 1 to 7 Myr with a slight peak at 3 Myr. However, the age of the high-mass stars depends on the adopted models and is 3.5 {+-} 0.5 Myr from the non-rotating or moderately rotating models of Brott et al. as well as the non-rotating models of Ekstroem et al. But the age is 4.0-7.0 Myr if the rotating models of Ekstroem et al. are adopted. This latter age is in excellent agreement with the timescale of ejection of the high-mass runaway star HD 153919 from NGC 6231, albeit the younger age cannot be entirely excluded.

  14. Transcriptional profiling differences for articular cartilage and repair tissue in equine joint surface lesions

    Stromberg Arnold J

    2009-09-01

    Full Text Available Abstract Background Full-thickness articular cartilage lesions that reach to the subchondral bone yet are restricted to the chondral compartment usually fill with a fibrocartilage-like repair tissue which is structurally and biomechanically compromised relative to normal articular cartilage. The objective of this study was to evaluate transcriptional differences between chondrocytes of normal articular cartilage and repair tissue cells four months post-microfracture. Methods Bilateral one-cm2 full-thickness defects were made in the articular surface of both distal femurs of four adult horses followed by subchondral microfracture. Four months postoperatively, repair tissue from the lesion site and grossly normal articular cartilage from within the same femorotibial joint were collected. Total RNA was isolated from the tissue samples, linearly amplified, and applied to a 9,413-probe set equine-specific cDNA microarray. Eight paired comparisons matched by limb and horse were made with a dye-swap experimental design with validation by histological analyses and quantitative real-time polymerase chain reaction (RT-qPCR. Results Statistical analyses revealed 3,327 (35.3% differentially expressed probe sets. Expression of biomarkers typically associated with normal articular cartilage and fibrocartilage repair tissue corroborate earlier studies. Other changes in gene expression previously unassociated with cartilage repair were also revealed and validated by RT-qPCR. Conclusion The magnitude of divergence in transcriptional profiles between normal chondrocytes and the cells that populate repair tissue reveal substantial functional differences between these two cell populations. At the four-month postoperative time point, the relative deficiency within repair tissue of gene transcripts which typically define articular cartilage indicate that while cells occupying the lesion might be of mesenchymal origin, they have not recapitulated differentiation to

  15. Oxygen 18 concentration profile measurements near the surface by 18O(p,α)15N resonance reaction

    Amsel, G.; David, D.

    1975-01-01

    The method of spectrum reduction in nuclear reaction microanalysis does not allow to obtain depth resolutions better than the order of 2000A. Resolutions of the order of 200A may be obtained by using the narrow resonance technique, when applied to thin films. The latter technique was extended to thick targets, with deep concentration profiles presenting a sharp gradient near the surface. This method is presented and illustrated by the study of 18 O profiles in oxygen diffusion measurements in growing ZrO 2 , using the 629keV resonance of the reaction 18 O(p,α) 15 N [fr

  16. Chemical metrology, strategic job for the Chilean Nuclear Energy Commission

    Gras, Nuri; Munoz, Luis; Cortes, Eduardo

    2001-01-01

    The National Standardization Institute's (INN) Metrology unit prepared a study in 1996 to evaluate the impact of metrological activity in Chile. This study was based on a survey of the supply and demand of metrological services and on studies of the behavior of the production system and technological services in Chile during the period 1990-1996. With the information obtained in this study the economic impact resulting from the lack of a national metrology system could be evaluated. This impact was estimated to be a 5% loss in gross national product equal to 125-500 million dollars because of direct product rejection in the mining, fisheries, agricultural and manufacturing sectors. Chemical measurements are responsible for 50% of these losses. In response to this need and coordinated by the INN, a metrological network of reference laboratories began to operate in 1997 for the principal physical magnitudes (mass, temperature, longitude and force) and a CORFO-FDI project began in 2001 that includes the chemical magnitudes. The Chilean Nuclear Energy Commission, aware of the problem's importance and the amount of economic damage that the country may suffer, as a result of these deficiencies, has formed a Chemical Metrology Unit to provide technical support. It aims to raise the standards of local analytical laboratories by providing international recognition to the export sector. Nuclear analytical techniques are used as reference methods. This work describes the laboratories that are included in this Chemical Metrology Unit and the historical contribution to the development of local analytical chemistry. The national and international projects are described together with the publications they have generated. The quality assurance program applied to the laboratories is described as well, which has led to the accreditation of the analytical chemical assays. The procedures used for validation and calculation of uncertain nuclear methodologies are described together with

  17. Metrology Sampling Strategies for Process Monitoring Applications

    Vincent, Tyrone L.

    2011-11-01

    Shrinking process windows in very large scale integration semiconductor manufacturing have already necessitated the development of control systems capable of addressing sub-lot-level variation. Within-wafer control is the next milestone in the evolution of advanced process control from lot-based and wafer-based control. In order to adequately comprehend and control within-wafer spatial variation, inline measurements must be performed at multiple locations across the wafer. At the same time, economic pressures prompt a reduction in metrology, for both capital and cycle-time reasons. This paper explores the use of modeling and minimum-variance prediction as a method to select the sites for measurement on each wafer. The models are developed using the standard statistical tools of principle component analysis and canonical correlation analysis. The proposed selection method is validated using real manufacturing data, and results indicate that it is possible to significantly reduce the number of measurements with little loss in the information obtained for the process control systems. © 2011 IEEE.

  18. Building versatile bipartite probes for quantum metrology

    Farace, Alessandro; De Pasquale, Antonella; Adesso, Gerardo; Giovannetti, Vittorio

    2016-01-01

    We consider bipartite systems as versatile probes for the estimation of transformations acting locally on one of the subsystems. We investigate what resources are required for the probes to offer a guaranteed level of metrological performance, when the latter is averaged over specific sets of local transformations. We quantify such a performance via the average skew information (AvSk), a convex quantity which we compute in closed form for bipartite states of arbitrary dimensions, and which is shown to be strongly dependent on the degree of local purity of the probes. Our analysis contrasts and complements the recent series of studies focused on the minimum, rather than the average, performance of bipartite probes in local estimation tasks, which was instead determined by quantum correlations other than entanglement. We provide explicit prescriptions to characterize the most reliable states maximizing the AvSk, and elucidate the role of state purity, separability and correlations in the classification of optimal probes. Our results can help in the identification of useful resources for sensing, estimation and discrimination applications when complete knowledge of the interaction mechanism realizing the local transformation is unavailable, and access to pure entangled probes is technologically limited.

  19. Metrology of ionizing radiations and environmental measurements

    Nourreddine, Abdel-Mjid

    2008-01-01

    The subject of radiation protection covers all measurements taken by the authorities to ensure protection of the population and its environment against the harmful effects of ionizing radiation. Dosimetry occupies an important place in this field, because it makes it possible to consider and to quantify the risk of using radiations in accordance with the prescribed limits. In this course, we will review the fundamental concepts used in the metrology and dosimetry of ionizing radiations. After classification of ionizing radiations according to their interactions with biological matter, we will present the various quantities and units brought into play and in particular the new operational quantities that are good estimators raising protection standards. They are directly connected to the annual limits of effective dose and of equivalent dose defined in the French regulation relating to the protection of the population and of workers against ionizing radiations. The average natural exposure of the population in France varies between 2 to 2.5 mSv per year, depending on geographic location. It comes principally from three sources: cosmic radiation, radioactive elements contained in the ground and radioactive elements that we absorb when breathing or eating. Radon, which is a naturally occurring radioactive gas, is a public health risk and represents 30% of the exposure. Finally, we will give some applications of dosimetry and environmental measurements developed recently at RaMsEs/IPHC laboratory of Strasbourg. (author)

  20. Metrological characterization of 3D imaging devices

    Guidi, G.

    2013-04-01

    Manufacturers often express the performance of a 3D imaging device in various non-uniform ways for the lack of internationally recognized standard requirements for metrological parameters able to identify the capability of capturing a real scene. For this reason several national and international organizations in the last ten years have been developing protocols for verifying such performance. Ranging from VDI/VDE 2634, published by the Association of German Engineers and oriented to the world of mechanical 3D measurements (triangulation-based devices), to the ASTM technical committee E57, working also on laser systems based on direct range detection (TOF, Phase Shift, FM-CW, flash LADAR), this paper shows the state of the art about the characterization of active range devices, with special emphasis on measurement uncertainty, accuracy and resolution. Most of these protocols are based on special objects whose shape and size are certified with a known level of accuracy. By capturing the 3D shape of such objects with a range device, a comparison between the measured points and the theoretical shape they should represent is possible. The actual deviations can be directly analyzed or some derived parameters can be obtained (e.g. angles between planes, distances between barycenters of spheres rigidly connected, frequency domain parameters, etc.). This paper shows theoretical aspects and experimental results of some novel characterization methods applied to different categories of active 3D imaging devices based on both principles of triangulation and direct range detection.

  1. Building versatile bipartite probes for quantum metrology

    Farace, Alessandro; Pasquale, Antonella De; Giovannetti, Vittorio; Adesso, Gerardo

    2016-01-01

    We consider bipartite systems as versatile probes for the estimation of transformations acting locally on one of the subsystems. We investigate what resources are required for the probes to offer a guaranteed level of metrological performance, when the latter is averaged over specific sets of local transformations. We quantify such a performance via the average skew information (AvSk), a convex quantity which we compute in closed form for bipartite states of arbitrary dimensions, and which is shown to be strongly dependent on the degree of local purity of the probes. Our analysis contrasts and complements the recent series of studies focused on the minimum, rather than the average, performance of bipartite probes in local estimation tasks, which was instead determined by quantum correlations other than entanglement. We provide explicit prescriptions to characterize the most reliable states maximizing the AvSk, and elucidate the role of state purity, separability and correlations in the classification of optimal probes. Our results can help in the identification of useful resources for sensing, estimation and discrimination applications when complete knowledge of the interaction mechanism realizing the local transformation is unavailable, and access to pure entangled probes is technologically limited. (paper)

  2. Nanomanufacturing metrology for cellulosic nanomaterials: an update

    Postek, Michael T.

    2014-08-01

    The development of the metrology and standards for advanced manufacturing of cellulosic nanomaterials (or basically, wood-based nanotechnology) is imperative to the success of this rising economic sector. Wood-based nanotechnology is a revolutionary technology that will create new jobs and strengthen America's forest-based economy through industrial development and expansion. It allows this, previously perceived, low-tech industry to leap-frog directly into high-tech products and processes and thus improves its current economic slump. Recent global investments in nanotechnology programs have led to a deeper appreciation of the high performance nature of cellulose nanomaterials. Cellulose, manufactured to the smallest possible-size ( 2 nm x 100 nm), is a high-value material that enables products to be lighter and stronger; have less embodied energy; utilize no catalysts in the manufacturing, are biologically compatible and, come from a readily renewable resource. In addition to the potential for a dramatic impact on the national economy - estimated to be as much as $250 billion worldwide by 2020 - cellulose-based nanotechnology creates a pathway for expanded and new markets utilizing these renewable materials. The installed capacity associated with the US pulp and paper industry represents an opportunity, with investment, to rapidly move to large scale production of nano-based materials. However, effective imaging, characterization and fundamental measurement science for process control and characterization are lacking at the present time. This talk will discuss some of these needed measurements and potential solutions.

  3. Advanced overlay analysis through design based metrology

    Ji, Sunkeun; Yoo, Gyun; Jo, Gyoyeon; Kang, Hyunwoo; Park, Minwoo; Kim, Jungchan; Park, Chanha; Yang, Hyunjo; Yim, Donggyu; Maruyama, Kotaro; Park, Byungjun; Yamamoto, Masahiro

    2015-03-01

    As design rule shrink, overlay has been critical factor for semiconductor manufacturing. However, the overlay error which is determined by a conventional measurement with an overlay mark based on IBO and DBO often does not represent the physical placement error in the cell area. The mismatch may arise from the size or pitch difference between the overlay mark and the cell pattern. Pattern distortion caused by etching or CMP also can be a source of the mismatch. In 2014, we have demonstrated that method of overlay measurement in the cell area by using DBM (Design Based Metrology) tool has more accurate overlay value than conventional method by using an overlay mark. We have verified the reproducibility by measuring repeatable patterns in the cell area, and also demonstrated the reliability by comparing with CD-SEM data. We have focused overlay mismatching between overlay mark and cell area until now, further more we have concerned with the cell area having different pattern density and etch loading. There appears a phenomenon which has different overlay values on the cells with diverse patterning environment. In this paper, the overlay error was investigated from cell edge to center. For this experiment, we have verified several critical layers in DRAM by using improved(Better resolution and speed) DBM tool, NGR3520.

  4. TSOM Method for Nanoelectronics Dimensional Metrology

    Attota, Ravikiran

    2011-01-01

    Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquiring and analyzing a set of optical images collected at various focus positions going through focus (from above-focus to under-focus). The measurement resolution is comparable to what is possible with typical light scatterometry, scanning electron microscopy (SEM) and atomic force microscopy (AFM). TSOM method is able to identify nanometer scale difference, type of the difference and magnitude of the difference between two nano/micro scale targets using a conventional optical microscope with visible wavelength illumination. Numerous industries could benefit from the TSOM method--such as the semiconductor industry, MEMS, NEMS, biotechnology, nanomanufacturing, data storage, and photonics. The method is relatively simple and inexpensive, has a high throughput, provides nanoscale sensitivity for 3D measurements and could enable significant savings and yield improvements in nanometrology and nanomanufacturing. Potential applications are demonstrated using experiments and simulations.

  5. X-ray beam-shaping via deformable mirrors: surface profile and point spread function computation for Gaussian beams using physical optics.

    Spiga, D

    2018-01-01

    X-ray mirrors with high focusing performances are commonly used in different sectors of science, such as X-ray astronomy, medical imaging and synchrotron/free-electron laser beamlines. While deformations of the mirror profile may cause degradation of the focus sharpness, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators. The resulting profile can be characterized with suitable metrology tools and correlated with the expected optical quality via a wavefront propagation code or, sometimes, predicted using geometric optics. In the latter case and for the special class of profile deformations with monotonically increasing derivative, i.e. concave upwards, the point spread function (PSF) can even be predicted analytically. Moreover, under these assumptions, the relation can also be reversed: from the desired PSF the required profile deformation can be computed analytically, avoiding the use of trial-and-error search codes. However, the computation has been so far limited to geometric optics, which entailed some limitations: for example, mirror diffraction effects and the size of the coherent X-ray source were not considered. In this paper, the beam-shaping formalism in the framework of physical optics is reviewed, in the limit of small light wavelengths and in the case of Gaussian intensity wavefronts. Some examples of shaped profiles are also shown, aiming at turning a Gaussian intensity distribution into a top-hat one, and checks of the shaping performances computing the at-wavelength PSF by means of the WISE code are made.

  6. Coupled ADCPs can yield complete Reynolds stress tensor profiles in geophysical surface flows

    Vermeulen, B.; Hoitink, A.J.F.; Sassi, M.G.

    2011-01-01

    We introduce a new technique to measure profiles of each term in the Reynolds stress tensor using coupled acoustic Doppler current profilers (ADCPs). The technique is based on the variance method which is extended to the case with eight acoustic beams. Methods to analyze turbulence from a single

  7. Investigation of Range Profiles from a Simplified Ship on Rough Sea Surface and Its Multipath Imaging Mechanisms

    Siyuan He

    2012-01-01

    Full Text Available The range profiles of a two-dimension (2 D perfect electric conductor (PEC ship on a wind-driven rough sea surface are derived by performing an inverse discrete Fourier transform (IDFT on the wide band backscattered field. The rough sea surface is assuming to be a PEC surface. The back scattered field is computed based on EM numerical simulation when the frequencies are sampled between 100 MHz and 700 MHz. Considering the strong coupling interactions between the ship and sea, the complicated multipath effect to the range profile characteristics is fully analyzed based on the multipath imaging mechanisms. The coupling mechanisms could be explained by means of ray theory prediction and numerical extraction of the coupling currents. The comparison of the range profile locations between ray theory prediction and surface current simulation is implemented and analyzed in this paper. Finally, the influence of different sea states on the radar target signatures has been examined and discussed.

  8. An automatic evaluation method for the surface profile of a microlens array using an optical interferometric microscope

    Lin, Chern-Sheng; Loh, Guo-Hao; Fu, Shu-Hsien; Chang, Hsun-Kai; Yang, Shih-Wei; Yeh, Mau-Shiun

    2010-01-01

    In this paper, an automatic evaluation method for the surface profile of a microlens array using an optical interferometric microscope is presented. For inspecting the microlens array, an XY-table is used to position it. With a He–Ne laser beam and optical fiber as a probing light, the measured image is sent to the computer to analyze the surface profile. By binary image slicing and area recognition, this study located the center of each ring and determined the substrate of the microlens array image through the background of the entire microlens array interference image. The maximum and minimum values of every segment brightness curve were determined corresponding to the change in the segment phase angle from 0° to 180°. According to the ratio of the actual ring area and the ideal ring area, the area ratio method was adopted to find the phase-angle variation of the interference ring. Based on the ratio of actual ring brightness and the ideal ring brightness, the brightness ratio method was used to determine the phase-angle variation of the interference ring fringe. The area ratio method and brightness ratio method are interchangeable in precisely determining the phase angles of the innermost and outermost rings of the interference fringe and obtaining different microlens surface altitudes of respective pixels in the segment, to greatly increase the microlens array surface profile inspection accuracy and quality

  9. Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

    Steinberger, R.; Celedón, C. E.; Bruckner, B.; Roth, D.; Duchoslav, J.; Arndt, M.; Kürnsteiner, P.; Steck, T.; Faderl, J.; Riener, C. K.; Angeli, G.; Bauer, P.; Stifter, D.

    2017-07-01

    Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

  10. Evaluation of metrology technologies for free form surfaces

    Arámbula, K.; Siller, H.R.; De Chiffre, Leonardo

    2012-01-01

    equipment when measuring free form components. Results demonstrate that there is the imperative need to assess the uncertainty and reproducibility of CT and photogrammetry measurements by applying some calibration procedures taking into account some recommendations for work piece alignment. This article...

  11. Radionuclide metrology: traceability and response to a radiological accident

    Tauhata, L.; Cruz, P.A.L. da; Silva, C.J. da; Delgado, J.U.; Oliveira, A.E. de; Oliveira, E.M. de; Poledna, R.; Loureiro, J. dos S.; Ferreira Filho, A.L.; Silva, R.L. da; Filho, O. L.T.; Santos, A.R.L. dos; Veras, E.V. de; Rangel, J. de A.; Quadros, A.L.L.; Araújo, M.T.F. de; Souza, P.S. de; Ruzzarim, A.; Conceição, D.A. da; Iwahara, A., E-mail: palcruz@ird.gov.br [Instituto de Radioproteção e Dosimetria (LNMRI/IRD/CNEN-RJ), Rio de Janeiro, RJ (Brazil). Lab. Nacional de Metrologia das Radiações Ionizantes

    2017-07-01

    In the case of a radiological accident, there are characteristic phases: discovery and initial assistance with first aid; the triage and monitoring of the affected population; the release of the affected people; forward the victims to medical care; as well as the preparation of the report on the accident. In addition, studies and associated researches performed in the later period. Monitors, dosimeters and measuring systems should be calibrated by contaminating radionuclide standards. The radioactive sources used must be metrologically reliable. In Brazil, this function is performed by LNMRI/IRD/CNEN, designated by INMETRO, which Radionuclide Metrology Laboratory is responsible for the standardization and supply of radioactive sources in diverse geometries and matrices. This laboratory has a stock of radionuclide solutions with controlled environmental variables for the preparation of sources, which are calibrated and standardized by mean of primary and secondary systems. It is also responsible for the dissemination of standards and, in order to establish the metrological traceability of national standards, participates in international key-comparisons promoted by BIPM and regional metrology organizations. Internally, it promotes the National Comparison Programs for laboratories for the analysis of environmental samples and the traceability for producing centers of radiopharmaceuticals and Nuclear Medicine Services in the country. The paper presents the demand for {sup 137}Cs related to the radioactive accident in Goiania/Brazil and the significant results for the main radionuclides standardized by the Radionuclide Metrology Laboratory for international key-comparisons and national comparisons to provide metrological traceability. With the obtained results, the LNMRI of Brazil integrates the international metrology BIPM network and fulfills its function of supplying, with about a hundred of radioactive standards, the country's needs in different applications

  12. Radionuclide metrology: traceability and response to a radiological accident

    Tauhata, L.; Cruz, P.A.L. da; Silva, C.J. da; Delgado, J.U.; Oliveira, A.E. de; Oliveira, E.M. de; Poledna, R.; Loureiro, J. dos S.; Ferreira Filho, A.L.; Silva, R.L. da; Filho, O. L.T.; Santos, A.R.L. dos; Veras, E.V. de; Rangel, J. de A.; Quadros, A.L.L.; Araújo, M.T.F. de; Souza, P.S. de; Ruzzarim, A.; Conceição, D.A. da; Iwahara, A.

    2017-01-01

    In the case of a radiological accident, there are characteristic phases: discovery and initial assistance with first aid; the triage and monitoring of the affected population; the release of the affected people; forward the victims to medical care; as well as the preparation of the report on the accident. In addition, studies and associated researches performed in the later period. Monitors, dosimeters and measuring systems should be calibrated by contaminating radionuclide standards. The radioactive sources used must be metrologically reliable. In Brazil, this function is performed by LNMRI/IRD/CNEN, designated by INMETRO, which Radionuclide Metrology Laboratory is responsible for the standardization and supply of radioactive sources in diverse geometries and matrices. This laboratory has a stock of radionuclide solutions with controlled environmental variables for the preparation of sources, which are calibrated and standardized by mean of primary and secondary systems. It is also responsible for the dissemination of standards and, in order to establish the metrological traceability of national standards, participates in international key-comparisons promoted by BIPM and regional metrology organizations. Internally, it promotes the National Comparison Programs for laboratories for the analysis of environmental samples and the traceability for producing centers of radiopharmaceuticals and Nuclear Medicine Services in the country. The paper presents the demand for 137 Cs related to the radioactive accident in Goiania/Brazil and the significant results for the main radionuclides standardized by the Radionuclide Metrology Laboratory for international key-comparisons and national comparisons to provide metrological traceability. With the obtained results, the LNMRI of Brazil integrates the international metrology BIPM network and fulfills its function of supplying, with about a hundred of radioactive standards, the country's needs in different applications

  13. Effect of measurement error budgets and hybrid metrology on qualification metrology sampling

    Sendelbach, Matthew; Sarig, Niv; Wakamoto, Koichi; Kim, Hyang Kyun (Helen); Isbester, Paul; Asano, Masafumi; Matsuki, Kazuto; Osorio, Carmen; Archie, Chas

    2014-10-01

    Until now, metrologists had no statistics-based method to determine the sampling needed for an experiment before the start that accuracy experiment. We show a solution to this problem called inverse total measurement uncertainty (TMU) analysis, by presenting statistically based equations that allow the user to estimate the needed sampling after providing appropriate inputs, allowing him to make important "risk versus reward" sampling, cost, and equipment decisions. Application examples using experimental data from scatterometry and critical dimension scanning electron microscope tools are used first to demonstrate how the inverse TMU analysis methodology can be used to make intelligent sampling decisions and then to reveal why low sampling can lead to unstable and misleading results. One model is developed that can help experimenters minimize sampling costs. A second cost model reveals the inadequacy of some current sampling practices-and the enormous costs associated with sampling that provides reasonable levels of certainty in the result. We introduce the strategies on how to manage and mitigate these costs and begin the discussion on how fabs are able to manufacture devices using minimal reference sampling when qualifying metrology steps. Finally, the relationship between inverse TMU analysis and hybrid metrology is explored.

  14. Modeling surface topography of state-of-the-art x-ray mirrors as a result of stochastic polishing process: recent developments

    Yashchuk, Valeriy V.; Centers, Gary; Tyurin, Yuri N.; Tyurina, Anastasia

    2016-09-01

    Recently, an original method for the statistical modeling of surface topography of state-of-the-art mirrors for usage in xray optical systems at light source facilities and for astronomical telescopes [Opt. Eng. 51(4), 046501, 2012; ibid. 53(8), 084102 (2014); and ibid. 55(7), 074106 (2016)] has been developed. In modeling, the mirror surface topography is considered to be a result of a stationary uniform stochastic polishing process and the best fit time-invariant linear filter (TILF) that optimally parameterizes, with limited number of parameters, the polishing process is determined. The TILF model allows the surface slope profile of an optic with a newly desired specification to be reliably forecast before fabrication. With the forecast data, representative numerical evaluations of expected performance of the prospective mirrors in optical systems under development become possible [Opt. Eng., 54(2), 025108 (2015)]. Here, we suggest and demonstrate an analytical approach for accounting the imperfections of the used metrology instruments, which are described by the instrumental point spread function, in the TILF modeling. The efficacy of the approach is demonstrated with numerical simulations for correction of measurements performed with an autocollimator based surface slope profiler. Besides solving this major metrological problem, the results of the present work open an avenue for developing analytical and computational tools for stitching data in the statistical domain, obtained using multiple metrology instruments measuring significantly different bandwidths of spatial wavelengths.

  15. Self-mixing interferometry: a novel yardstick for mechanical metrology

    Donati, Silvano

    2016-11-01

    A novel configuration of interferometry, SMI (self-mixing interferometry), is described in this paper. SMI is attractive because it doesn't require any optical part external to the laser and can be employed in a variety of measurements - indeed it is sometimes indicated as the "interferometer for measuring without an interferometer". On processing the phase carried by the optical field upon propagation to the target under test, a number of applications have been developed, including traditional measurements related to metrology and mechanical engineering - like displacement, distance, small-amplitude vibrations, attitude angles, velocity, as well as new measurements, like mechanical stress-strain hysterisis and microstructure/MEMS electro-mechanical response. In another field, sensing of motility finds direct application in a variety of biophysical measurements, like blood pulsation, respiratory sounds, chest acoustical impedance, and blood velocity profile. And, we may also look at the amplitude of the returning signal in a SMI, and we can measure weak optical echoes - for return loss and isolation factor measurements, CD readout and scroll sensing, and THz-wave detection. Last, the fine details of the SMI waveform reveal physical parameters of the laser like the laser linewidth, coherence length, and alpha factor. Worth to be noted, SMI is also a coherent detection scheme, and measurement close to the quantum limit of received field with minimum detectable displacements of 100 pm/√Hz are currently achieved upon operation on diffusive targets, whereas in detection mode returning signal can be sensed down to attenuations of -80dB.

  16. Limitations in SELDI-TOF MS whole serum proteomic profiling with IMAC surface to specifically detect colorectal cancer

    Wang, Qi; Gu, Jin; Shen, Jing; Li, Zhen-fu; Jie, Jian-zheng; Wang, Wen-yue; Wang, Jin; Zhang, Zhong-tao; Li, Zhi-xia; Yan, Li

    2009-01-01

    Surface enhanced laser desorption and ionization time-of-flight mass spectrometry (SELDI-TOF-MS) analysis on serum samples was reported to be able to detect colorectal cancer (CRC) from normal or control patients. We carried out a validation study of a SELDI-TOF MS approach with IMAC surface sample processing to identify CRC. A retrospective cohort of 338 serum samples including 154 CRCs, 67 control cancers and 117 non-cancerous conditions was profiled using SELDI-TOF-MS. No CRC 'specific' classifier was found. However, a classifier consisting of two protein peaks separates cancer from non-cancerous conditions with high accuracy. In this study, the SELDI-TOF-MS-based protein expression profiling approach did not perform to identify CRC. However, this technique is promising in distinguishing patients with cancer from a non-cancerous population; it may be useful for monitoring recurrence of CRC after treatment

  17. Calibration of radioprotection equipment gamma radiation at the Laboratory of Ionizing Radiation Metrology - DEN/UFPE

    Nazario, Macilene; Khoury, Helen; Hazin, Clovis

    2003-01-01

    This work presents aspects of the radioprotection equipment calibration service of the Laboratory for Metrology of Ionizing Radiations (LMRI) of the DEN/UFPE related to the calibration procedures, characteristics of the radiation beam and the evaluation of equipment calibrated in the period of 2001-2002. The LMRI-DEN/UFPE is one of the four laboratories in Brazil licensed by the Brazilian Nuclear Energy Commission for the execution of calibration services on area, surface contamination and personal monitors used by industries, hospitals, universities and research institutes using radioactive sources

  18. Radiation effects on optical components of a laser radar sensor designed for remote metrology in ITER

    Menon, M.M.; Grann, E.B.; Slotwinski, A.

    1997-09-01

    A frequency modulated laser radar is being developed for in-vessel metrology and viewing of plasma-facing surfaces. Some optical components of this sensor must withstand intense gamma radiation (3 x 10 6 rad/h) during operation. The authors have tested the effect of radiation on a silica core polarization maintaining optical fiber and on TeO 2 crystals at doses up to ∼ 10 9 rad. Additional tests are planned for evaluating the performance of a complete acousto-optic (AO) scanning device. The progress made in these tests is also described

  19. Simulated X-ray galaxy clusters at the virial radius: Slopes of the gas density, temperature and surface brightness profiles

    Roncarelli, M.; Ettori, S.; Dolag, K.; Moscardini, L.; Borgani, S.; Murante, G.

    2006-12-01

    Using a set of hydrodynamical simulations of nine galaxy clusters with masses in the range 1.5 × 1014 matter of tension between simulated and observed properties, and up to the virial radius and beyond, where present observations are unable to provide any constraints. We have modelled the radial profiles between 0.3R200 and 3R200 with power laws with one index, two indexes and a rolling index. The simulated temperature and [0.5-2] keV surface brightness profiles well reproduce the observed behaviours outside the core. The shape of all these profiles in the radial range considered depends mainly on the activity of the gravitational collapse, with no significant difference among models including extraphysics. The profiles steepen in the outskirts, with the slope of the power-law fit that changes from -2.5 to -3.4 in the gas density, from -0.5 to -1.8 in the gas temperature and from -3.5 to -5.0 in the X-ray soft surface brightness. We predict that the gas density, temperature and [0.5-2] keV surface brightness values at R200 are, on average, 0.05, 0.60, 0.008 times the measured values at 0.3R200. At 2R200, these values decrease by an order of magnitude in the gas density and surface brightness, by a factor of 2 in the temperature, putting stringent limits on the detectable properties of the intracluster-medium (ICM) in the virial regions.

  20. [The EFS metrology: From the production to the reason].

    Reifenberg, J-M; Riout, E; Leroy, A; Begue, S

    2014-06-01

    In order to answer statutory requirements and to anticipate the future needs and standards, the EFS is committed, since a few years, in a process of harmonization of its metrology function. In particular, the institution has opted for the skills development by internalizing the metrological traceability of the main critical quantities (temperature, volumetric) measurements. The development of metrology so resulted in a significant increase in calibration and testing activities. Methods are homogenized and improved through accreditations. The investment strategies are based on more and more demanding specifications. The performance of the equipments is better known and mastered. Technical expertise and maturity of the national metrology function today are assets to review in more informed ways the appropriateness of the applied periodicities. Analysis of numerous information and data in the calibration and testing reports could be pooled and operated on behalf of the unique establishment. The objective of this article is to illustrate these reflections with a few examples from of a feedback of the EFS Pyrénées Méditerranée. The analysis of some methods of qualification, the exploitation of the historical metrology in order to quantify the risk of non-compliance, and to adapt the control strategy, analysis of the criticality of an instrument in a measurement process, risk analyses are tools that deserve to be more widely exploited for that discipline wins in efficiency at the national level. Copyright © 2014 Elsevier Masson SAS. All rights reserved.

  1. Introduction to quantum metrology quantum standards and instrumentation

    Nawrocki, Waldemar

    2015-01-01

    This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called  Quantum SI, is introduced. This book helps to understand and approve the new system to both technology a...

  2. Laser metrology for a next generation gravimetric mission

    Mottini, Sergio; Biondetti, Giorgio; Cesare, Stefano; Castorina, Giuseppe; Musso, Fabio; Pisani, Marco; Leone, Bruno

    2017-11-01

    Within the ESA technology research project "Laser Interferometer High Precision tracking for LEO", Thales Alenia Space Italia is developing a laser metrology system for a Next Generation Gravimetric Mission (NGGM) based on satellite-to-satellite tracking. This technique is based on the precise measurement of the displacement between two satellites flying in formation at low altitude for monitoring the variations of Earth's gravity field at high resolution over a long time period. The laser metrology system that has been defined for this mission consists of the following elements: • an heterodyne Michelson interferometer for measuring the distance variation between retroreflectors positioned on the two satellites; • an angle metrology for measuring the orientation of the laser beam in the reference frames of the two satellites; • a lateral displacement metrology for measuring the deviations of the laser beam axis from the target retro-reflector. The laser interferometer makes use of a chopped measurement beam to avoid spurious signals and nonlinearity caused by the unbalance between the strong local beam and the weak return beam. The main results of the design, development and test activities performed on the breadboard of the metrology system are summarized in this paper.

  3. X-ray metrology and performance of a 45-cm long x-ray deformable mirror

    Poyneer, Lisa A., E-mail: poyneer1@llnl.gov; Brejnholt, Nicolai F.; Hill, Randall; Jackson, Jessie; Hagler, Lisle [Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Celestre, Richard; Feng, Jun [Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, California 94720 (United States)

    2016-05-15

    We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.

  4. Advanced X-ray Optics Metrology for Nanofocusing and Coherence Preservation

    Goldberg, Kenneth A.; Yashchuk, Valeriy

    2007-12-01

    What is the point of developing new high-brightness light sources if beamline optics won't be available to realize the goals of nano-focusing and coherence preservation? That was one of the central questions raised during a workshop at the 2007 Advanced Light Source Users Meeting. Titled, 'Advanced X-Ray Optics Metrology for Nano-focusing and Coherence Preservation', the workshop was organized by Kenneth Goldberg and Valeriy Yashchuk (both of Lawrence Berkeley National Laboratory, LBNL), and it brought together industry representatives and researchers from Japan, Europe, and the US to discuss the state of the art and to outline the optics requirements of new light sources. Many of the presentations are viewable on the workshop website http://goldberg.lbl.gov/MetrologyWorkshop07/. Many speakers shared the same view of one of the most significant challenges facing the development of new high-brightness third and fourth generation x-ray, soft x-ray, and EUV light sources: these sources place extremely high demands on the surface quality of beamline optics. In many cases, the 1-2-nm surface error specs that define the outer bounds of 'diffraction-limited' quality are beyond the reach of leading facilities and optics vendors. To focus light to 50-nm focal spots, or smaller, from reflective optics and to preserve the high coherent flux that new sources make possible, the optical surface quality and alignment tolerances must be measured in nano-meters and nano-radians. Without a significant, well-supported research effort, including the development of new metrology techniques for use both on and off the beamline, these goals will likely not be met. The scant attention this issue has garnered is evident in the stretched budgets and limited manpower currently dedicated to metrology. With many of the world's leading groups represented at the workshop, it became clear that Japan and Europe are several steps ahead of the US in this critical area

  5. The coming of age of the first hybrid metrology software platform dedicated to nanotechnologies (Conference Presentation)

    Foucher, Johann; Labrosse, Aurelien; Dervillé, Alexandre; Zimmermann, Yann; Bernard, Guilhem; Martinez, Sergio; Grönqvist, Hanna; Baderot, Julien; Pinzan, Florian

    2017-03-01

    The development and integration of new materials and structures at the nanoscale require multiple parallel characterizations in order to control mostly physico-chemical properties as a function of applications. Among all properties, we can list physical properties such as: size, shape, specific surface area, aspect ratio, agglomeration/aggregation state, size distribution, surface morphology/topography, structure (including crystallinity and defect structure), solubility and chemical properties such as: structural formula/molecular structure, composition (including degree of purity, known impurities or additives), phase identity, surface chemistry (composition, charge, tension, reactive sites, physical structure, photocatalytic properties, zeta potential), hydrophilicity/lipophilicity. Depending on the final material formulation (aerosol, powder, nanostructuration…) and the industrial application (semiconductor, cosmetics, chemistry, automotive…), a fleet of complementary characterization equipments must be used in synergy for accurate process tuning and high production yield. The synergy between equipment so-called hybrid metrology consists in using the strength of each technique in order to reduce the global uncertainty for better and faster process control. The only way to succeed doing this exercise is to use data fusion methodology. In this paper, we will introduce the work that has been done to create the first generic hybrid metrology software platform dedicated to nanotechnologies process control. The first part will be dedicated to process flow modeling that is related to a fleet of metrology tools. The second part will introduce the concept of entity model which describes the various parameters that have to be extracted. The entity model is fed with data analysis as a function of the application (automatic analysis or semi-automated analysis). The final part will introduce two ways of doing data fusion on real data coming from imaging (SEM, TEM, AFM

  6. Cell surface profiling using high-throughput flow cytometry: a platform for biomarker discovery and analysis of cellular heterogeneity.

    Craig A Gedye

    Full Text Available Cell surface proteins have a wide range of biological functions, and are often used as lineage-specific markers. Antibodies that recognize cell surface antigens are widely used as research tools, diagnostic markers, and even therapeutic agents. The ability to obtain broad cell surface protein profiles would thus be of great value in a wide range of fields. There are however currently few available methods for high-throughput analysis of large numbers of cell surface proteins. We describe here a high-throughput flow cytometry (HT-FC platform for rapid analysis of 363 cell surface antigens. Here we demonstrate that HT-FC provides reproducible results, and use the platform to identify cell surface antigens that are influenced by common cell preparation methods. We show that multiple populations within complex samples such as primary tumors can be simultaneously analyzed by co-staining of cells with lineage-specific antibodies, allowing unprecedented depth of analysis of heterogeneous cell populations. Furthermore, standard informatics methods can be used to visualize, cluster and downsample HT-FC data to reveal novel signatures and biomarkers. We show that the cell surface profile provides sufficient molecular information to classify samples from different cancers and tissue types into biologically relevant clusters using unsupervised hierarchical clustering. Finally, we describe the identification of a candidate lineage marker and its subsequent validation. In summary, HT-FC combines the advantages of a high-throughput screen with a detection method that is sensitive, quantitative, highly reproducible, and allows in-depth analysis of heterogeneous samples. The use of commercially available antibodies means that high quality reagents are immediately available for follow-up studies. HT-FC has a wide range of applications, including biomarker discovery, molecular classification of cancers, or identification of novel lineage specific or stem cell

  7. Cell surface profiling using high-throughput flow cytometry: a platform for biomarker discovery and analysis of cellular heterogeneity.

    Gedye, Craig A; Hussain, Ali; Paterson, Joshua; Smrke, Alannah; Saini, Harleen; Sirskyj, Danylo; Pereira, Keira; Lobo, Nazleen; Stewart, Jocelyn; Go, Christopher; Ho, Jenny; Medrano, Mauricio; Hyatt, Elzbieta; Yuan, Julie; Lauriault, Stevan; Meyer, Mona; Kondratyev, Maria; van den Beucken, Twan; Jewett, Michael; Dirks, Peter; Guidos, Cynthia J; Danska, Jayne; Wang, Jean; Wouters, Bradly; Neel, Benjamin; Rottapel, Robert; Ailles, Laurie E

    2014-01-01

    Cell surface proteins have a wide range of biological functions, and are often used as lineage-specific markers. Antibodies that recognize cell surface antigens are widely used as research tools, diagnostic markers, and even therapeutic agents. The ability to obtain broad cell surface protein profiles would thus be of great value in a wide range of fields. There are however currently few available methods for high-throughput analysis of large numbers of cell surface proteins. We describe here a high-throughput flow cytometry (HT-FC) platform for rapid analysis of 363 cell surface antigens. Here we demonstrate that HT-FC provides reproducible results, and use the platform to identify cell surface antigens that are influenced by common cell preparation methods. We show that multiple populations within complex samples such as primary tumors can be simultaneously analyzed by co-staining of cells with lineage-specific antibodies, allowing unprecedented depth of analysis of heterogeneous cell populations. Furthermore, standard informatics methods can be used to visualize, cluster and downsample HT-FC data to reveal novel signatures and biomarkers. We show that the cell surface profile provides sufficient molecular information to classify samples from different cancers and tissue types into biologically relevant clusters using unsupervised hierarchical clustering. Finally, we describe the identification of a candidate lineage marker and its subsequent validation. In summary, HT-FC combines the advantages of a high-throughput screen with a detection method that is sensitive, quantitative, highly reproducible, and allows in-depth analysis of heterogeneous samples. The use of commercially available antibodies means that high quality reagents are immediately available for follow-up studies. HT-FC has a wide range of applications, including biomarker discovery, molecular classification of cancers, or identification of novel lineage specific or stem cell markers.

  8. Electromagnetic response of the protective pellicle of Euglenoids: influence of the surface profile

    Inchaussandague, Marina E.; Gigli, Miriam L.; Skigin, Diana C.; Tolivia, Analía.; Conforti, Visitación

    2015-03-01

    In a recent paper we have investigated, from an electromagnetic point of view, the role played by the pellicle of Euglenoids -unicellular aquatic organisms- in the protection of the cell against UV radiation.14 By modelling the pellicle as a diffraction grating, we computed the electromagnetic response of different species that exhibit different behaviors against UV radiation. In this previous study, the pellicle profile was approximated by a sinusoidal grating. However, it has been observed in the transversal cut images that the profiles are not exactly sinusoidal, and also vary from sample to sample. Since the electromagnetic response depends on the geometry of the grating, reflectance calculations that take into account a more accurate representation of the actual profile could provide more insight into this problem. In this paper we investigate the electromagnetic response of the pellicle of Euglenoids for different grating profiles. The diffraction problem is solved by using the Chandezon method, which has demonstrated a successful performance for deep gratings of arbitrary profiles. We analyze the influence of the shape, depth and period of the grating on the UV reflectance. We show that the pellicle characteristics are critical parameters to increase the reflectance, thus reducing the penetration of the UV radiation within the cell and therefore, minimizing the damage and increasing the survival of these organisms.

  9. Dynamic Length Metrology (DLM) for measurements with sub-micrometre uncertainty in a production environment

    De Chiffre, Leonardo; Hansen, Hans Nørgaard; Hattel, Jesper Henri

    2016-01-01

    Conventional length metrology for traceable accurate measurements requires costly temperature controlled facilities, long waiting time for part acclimatisation, and separate part material characterisation. This work describes a method called Dynamic Length Metrology (DLM) developed to achieve sub...

  10. Laser metrology and optic active control system for GAIA

    D'Angelo, F.; Bonino, L.; Cesare, S.; Castorina, G.; Mottini, S.; Bertinetto, F.; Bisi, M.; Canuto, E.; Musso, F.

    2017-11-01

    The Laser Metrology and Optic Active Control (LM&OAC) program has been carried out under ESA contract with the purpose to design and validate a laser metrology system and an actuation mechanism to monitor and control at microarcsec level the stability of the Basic Angle (angle between the lines of sight of the two telescopes) of GAIA satellite. As part of the program, a breadboard (including some EQM elements) of the laser metrology and control system has been built and submitted to functional, performance and environmental tests. In the followings we describe the mission requirements, the system architecture, the breadboard design, and finally the performed validation tests. Conclusion and appraisals from this experience are also reported.

  11. Automation of testing the metrological reliability of nondestructive control systems

    Zhukov, Yu.A.; Isakov, V.B.; Karlov, Yu.K.; Kovalevskij, Yu.A.

    1987-01-01

    Opportunities of microcomputers are used to solve the problem of testing control-measuring systems. Besides the main program the program of data processing when characterizing the nondestructive control systems is written in the microcomputer. The program includes two modules. The first module contains tests-programs, by which accuracy of functional elements of the microcomputer and interface elements with issuing a message to the operator on readiness of the elements for operation and failure of a certain element are determined. The second module includes: calculational programs when determining metrological reliability of measuring channel reliability, a calculational subprogram for random statistical measuring error, time instability and ''dead time''. Automation of testing metrological reliability of the nondestructive control systems increases reliability of determining metrological parameters and reduces time of system testing

  12. Joint Research on Scatterometry and AFM Wafer Metrology

    Bodermann, Bernd; Buhr, Egbert; Danzebrink, Hans-Ulrich; Bär, Markus; Scholze, Frank; Krumrey, Michael; Wurm, Matthias; Klapetek, Petr; Hansen, Poul-Erik; Korpelainen, Virpi; van Veghel, Marijn; Yacoot, Andrew; Siitonen, Samuli; El Gawhary, Omar; Burger, Sven; Saastamoinen, Toni

    2011-11-01

    Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatterometry for traceable linewidth metrology. Both experimental and modelling methods will be enhanced and different methods will be compared with each other and with specially adapted atomic force microscopy (AFM) and scanning electron microscopy (SEM) measurement systems in measurement comparisons. Additionally novel methods for sophisticated data analysis will be developed and investigated to reach significant reductions of the measurement uncertainties in critical dimension (CD) metrology. One final goal will be the realisation of a wafer based reference standard material for calibration of scatterometers.

  13. One- and two-dimensional dopant/carrier profiling for ULSI

    Vandervorst, W.; Clarysse, T.; De Wolf, P.; Trenkler, T.; Hantschel, T.; Stephenson, R.; Janssens, T.

    1998-11-01

    Dopant/carrier profiles constitute the basis of the operation of a semiconductor device and thus play a decisive role in the performance of a transistor and are subjected to the same scaling laws as the other constituents of a modern semiconductor device and continuously evolve towards shallower and more complex configurations. This evolution has increased the demands on the profiling techniques in particular in terms of resolution and quantification such that a constant reevaluation and improvement of the tools is required. As no single technique provides all the necessary information (dopant distribution, electrical activation,..) with the requested spatial and depth resolution, the present paper attempts to provide an assessment of those tools which can be considered as the main metrology technologies for ULSI-applications. For 1D-dopant profiling secondary ion mass spectrometry (SIMS) has progressed towards a generally accepted tool meeting the requirements. For 1D-carrier profiling spreading resistance profiling and microwave surface impedance profiling are envisaged as the best choices but extra developments are required to promote them to routinely applicable methods. As no main metrology tool exist for 2D-dopant profiling, main emphasis is on 2D-carrier profiling tools based on scanning probe microscopy. Scanning spreading resistance (SSRM) and scanning capacitance microscopy (SCM) are the preferred methods although neither of them already meets all the requirements. Complementary information can be extracted from Nanopotentiometry which samples the device operation in more detail. Concurrent use of carrier profiling tools, Nanopotentiometry, analysis of device characteristics and simulations is required to provide a complete characterization of deep submicron devices.

  14. The Act of 17 March 2000 on metrology and on changes and amendments of some acts

    2000-01-01

    This act metrology for organization of unity and correctness of mensuration adapts (a) the law measurement units, (b) the requests on committed gauges and their metrological control, (c) the conditions of official mensuration, (d) the requests on consumptive packages articles; (e) the conditions of authorization and registration, (f) operation of organs of the state administration for metrology, (g) the metrological authority (h) putting of fines. This act shall into effect on 1 July 2000

  15. Metrology and analytical chemistry: Bridging the cultural gap

    King, Bernard

    2002-01-01

    Metrology in general and issues such as traceability and measurement uncertainty in particular are new to most analytical chemists and many remain to be convinced of their value. There is a danger of the cultural gap between metrologists and analytical chemists widening with unhelpful consequences and it is important that greater collaboration and cross-fertilisation is encouraged. This paper discusses some of the similarities and differences in the approaches adopted by metrologists and analytical chemists and indicates how these approaches can be combined to establish a unique metrology of chemical measurement which could be accepted by both cultures. (author)

  16. Mycotoxin metrology: Gravimetric production of zearalenone calibration solution

    Rego, E. C. P.; Simon, M. E.; Li, Xiuqin; Li, Xiaomin; Daireaux, A.; Choteau, T.; Westwood, S.; Josephs, R. D.; Wielgosz, R. I.; Cunha, V. S.

    2018-03-01

    Food safety is a major concern for countries developing metrology and quality assurance systems, including the contamination of food and feed by mycotoxins. To improve the mycotoxin analysis and ensure the metrological traceability, CRM of calibration solution should be used. The production of certified mycotoxin solutions is a major challenge due to the limited amount of standard for conducting a proper purity study and due to the cost of standards. The CBKT project was started at BIPM and Inmetro produced gravimetrically one batch of zearelenone in acetronitrile (14.708 ± 0.016 μg/g, k=2) and conducted homogeneity, stability and value assignment studies.

  17. Forum metrology 2009: control of optics, targets and optical analyzers

    Desenne, D.; Andre, R.

    2010-01-01

    The 1. 'Forum Metrologie' of the CEA/DAM has been held in the 'Institut Laser et Plasma' on the December 9, 2009, close to the 'Centre d'etudes Scientifiques et Techniques d'Aquitaine'. It has been set up by the 'Departement Lasers de Puissance'. The chosen thematic was the metrology around laser experiments, with a special focus on the metrology of the dedicated optics, targets and optical analysers. The talks have shown the progress and difficulties in each of these fields. (authors)

  18. Metrology in CNEN NN 3.05/13 standard

    Mello, Marina Santiago de

    2014-01-01

    The nuclear medicine exams are widely used tools in health services for a reliable clinical and functional diagnosis of a disease. In Brazil, the National Nuclear Energy Commission, through the norm CNEN-NN 3:05/13, provides for the requirements of safety and radiological protection in nuclear medicine services. The objective of this review article was to emphasize the importance of metrology in compliance with this norm. We observed that metrology plays a vital role as it ensures the quality, accuracy, reproducibility and consistency of the measurements in the field of nuclear medicine. (author)

  19. Handbook of 3D machine vision optical metrology and imaging

    Zhang, Song

    2013-01-01

    With the ongoing release of 3D movies and the emergence of 3D TVs, 3D imaging technologies have penetrated our daily lives. Yet choosing from the numerous 3D vision methods available can be frustrating for scientists and engineers, especially without a comprehensive resource to consult. Filling this gap, Handbook of 3D Machine Vision: Optical Metrology and Imaging gives an extensive, in-depth look at the most popular 3D imaging techniques. It focuses on noninvasive, noncontact optical methods (optical metrology and imaging). The handbook begins with the well-studied method of stereo vision and

  20. Improved capacity in ionizing radiation metrology at SANAEM

    Yucel, U.

    2014-01-01

    Full text : Turkey is planning to build nuclear power plants in the south and north coasts to supply the ever-increasing energy demand. The nuclear power plants based on old soviet technology in Armenia and Bulgaria close to Turkey's borders also makes constant monitoring of environmental radioactivity extremely important due to public health and environment contamination concerns. Radiation Metrology Division at SANAEM has been established in 2012 to provide uniformity and reliability of the measurements in the field of ionizing radiation metrology by R and D studies and by constituting, developing, keeping and extending internationally accepted reference measurement standards and techniques

  1. Dark matter: a problem in relativistic metrology?

    Lusanna, Luca

    2017-01-01

    Besides the tidal degrees of freedom of Einstein general relativity (GR) (namely the two polarizations of gravitational waves after linearization of the theory) there are the inertial gauge ones connected with the freedom in the choice of the 4-coordinates of the space-time, i.e. in the choice of the notions of time and 3-space (the 3+1 splitting of space-time) and in their use to define a non-inertial frame (the inertial ones being forbidden by the equivalence principle) by means of a set of conventions for the relativistic metrology of the space-time (like the GPS ones near the Earth). The canonical York basis of canonical ADM gravity allows us to identify the Hamiltonian inertial gauge variables in globally hyperbolic asymptotically Minkowskian space-times without super-translations and to define the family of non-harmonic Schwinger time gauges. In these 3+1 splittings of space-time the freedom in the choice of time (the problem of clock synchronization) is described by the inertial gauge variable York time (the trace of the extrinsic curvature of the instantaneous 3-spaces). This inertial gauge freedom and the non-Euclidean nature of the instantaneous 3-spaces required by the equivalence principle need to be incorporated as metrical conventions in a relativistic suitable extension of the existing (essentially Galilean) ICRS celestial reference system. In this paper I make a short review of the existing possibilities to explain the presence of dark matter (or at least of part of it) as a relativistic inertial effect induced by the non- Euclidean nature of the 3-spaces. After a Hamiltonian Post-Minkowskian (HPM) linearization of canonical ADM tetrad gravity with particles, having equal inertial and gravitational masses, as matter, followed by a Post-Newtonian (PN) expansion, we find that the Newtonian equality of inertial and gravitational masses breaks down and that the inertial gauge York time produces an increment of the inertial masses explaining at least

  2. Metrological evaluation of characterization methods applied to nuclear fuels

    Faeda, Kelly Cristina Martins; Lameiras, Fernando Soares; Camarano, Denise das Merces; Ferreira, Ricardo Alberto Neto; Migliorini, Fabricio Lima; Carneiro, Luciana Capanema Silva; Silva, Egonn Hendrigo Carvalho

    2010-01-01

    In manufacturing the nuclear fuel, characterizations are performed in order to assure the minimization of harmful effects. The uranium dioxide is the most used substance as nuclear reactor fuel because of many advantages, such as: high stability even when it is in contact with water at high temperatures, high fusion point, and high capacity to retain fission products. Several methods are used for characterization of nuclear fuels, such as thermogravimetric analysis for the ratio O / U, penetration-immersion method, helium pycnometer and mercury porosimetry for the density and porosity, BET method for the specific surface, chemical analyses for relevant impurities, and the laser flash method for thermophysical properties. Specific tools are needed to control the diameter and the sphericity of the microspheres and the properties of the coating layers (thickness, density, and degree of anisotropy). Other methods can also give information, such as scanning and transmission electron microscopy, X-ray diffraction, microanalysis, and mass spectroscopy of secondary ions for chemical analysis. The accuracy of measurement and level of uncertainty of the resulting data are important. This work describes a general metrological characterization of some techniques applied to the characterization of nuclear fuel. Sources of measurement uncertainty were analyzed. The purpose is to summarize selected properties of UO 2 that have been studied by CDTN in a program of fuel development for Pressurized Water Reactors (PWR). The selected properties are crucial for thermalhydraulic codes to study basic design accidents. The thermal characterization (thermal diffusivity and thermal conductivity) and the penetration immersion method (density and open porosity) of UO 2 samples were focused. The thermal characterization of UO 2 samples was determined by the laser flash method between room temperature and 448 K. The adaptive Monte Carlo Method was used to obtain the endpoints of the

  3. Progress in the specification of optical instruments for the measurement of surface form and texture

    de Groot, Peter J.

    2014-05-01

    Specifications for confocal microscopes, optical interferometers and other methods of measuring areal surface topography can be confusing and misleading. The emerging ISO 25178 standards, together with the established international vocabulary of metrology, provide a foundation for improved specifications for 3D surface metrology instrumentation. The approach in this paper links instrument specifications to metrological characteristics that can influence a measurement, using consistent definitions of terms, and reference to verification procedures.

  4. Developmental long trace profiler using optimally aligned mirror based pentaprism

    Barber, Samuel K.; Morrison, Gregory Y.; Yashchuk, Valeriy V.; Gubarev, Mikhail V.; Geckeler, Ralf D.; Buchheim, Jana; Siewert, Frank; Zeschke, Thomas

    2010-01-01

    A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was recently brought into operation at the Advanced Light Source Optical Metrology Laboratory (Nucl. Instr. and Meth. A 616, 212-223 (2010)). The instrument is based on a precisely calibrated autocollimator and a movable pentaprism. The capability of the DLTP to achieve sub-microradian surface slope metrology has been verified via cross-comparison measurements with other high-performance slope measuring instruments when measuring the same high-quality test optics. In the present work, a further improvement of the DLTP is achieved by replacing the existing bulk pentaprism with a specially designed mirror based pentaprism. A mirror based pentaprism offers the possibility to eliminate systematic errors introduced by inhomogeneity of the optical material and fabrication imperfections of a bulk pentaprism. We provide the details of the mirror based pentaprism design and describe an original experimental procedure for precision mutual alignment of the mirrors. The algorithm of the alignment procedure and its efficiency are verified with rigorous ray tracing simulations. Results of measurements of a spherically curved test mirror and a flat test mirror using the original bulk pentaprism are compared with measurements using the new mirror based pentaprism, demonstrating the improved performance.

  5. Free surface profiles in river flows: Can standard energy-based gradually-varied flow computations be pursued?

    Cantero, Francisco; Castro-Orgaz, Oscar; Garcia-Marín, Amanda; Ayuso, José Luis; Dey, Subhasish

    2015-10-01

    Is the energy equation for gradually-varied flow the best approximation for the free surface profile computations in river flows? Determination of flood inundation in rivers and natural waterways is based on the hydraulic computation of flow profiles. This is usually done using energy-based gradually-varied flow models, like HEC-RAS, that adopts a vertical division method for discharge prediction in compound channel sections. However, this discharge prediction method is not so accurate in the context of advancements over the last three decades. This paper firstly presents a study of the impact of discharge prediction on the gradually-varied flow computations by comparing thirteen different methods for compound channels, where both energy and momentum equations are applied. The discharge, velocity distribution coefficients, specific energy, momentum and flow profiles are determined. After the study of gradually-varied flow predictions, a new theory is developed to produce higher-order energy and momentum equations for rapidly-varied flow in compound channels. These generalized equations enable to describe the flow profiles with more generality than the gradually-varied flow computations. As an outcome, results of gradually-varied flow provide realistic conclusions for computations of flow in compound channels, showing that momentum-based models are in general more accurate; whereas the new theory developed for rapidly-varied flow opens a new research direction, so far not investigated in flows through compound channels.

  6. Effects of Inner Surface Roughness and Asymmetric Pipe Flow on Accuracy of Profile Factor for Ultrasonic Flow Meter

    Michitsugu Mori; Kenichi Tezuka; Yasushi Takeda

    2006-01-01

    Flow profile factors (PFs), which adjust measurements to real flow rates, also strongly depend on flow profiles. To determine profile factors for actual power plants, manufactures of flowmeters usually conduct factory calibration tests under ambient flow conditions. Indeed, flow measurements with high accuracy for reactor feedwater require them to conduct calibration tests under real conditions, such as liquid conditions and piping layouts. On the contrary, as nuclear power plants are highly aging, readings of flowmeters for reactor feedwater systems drift due to the changes of flow profiles. The causes of those deviations are affected by the change of wall roughness of inner surface of pipings. We have conducted experiments to quantify the effects of flow patterns on the PFs due to pipe roughness and asymmetric flow, and the results of our experiments have shown the effects of elbows and pipe inner roughness, which strongly affect to the creation of the flow patterns. Those changes of flow patterns lead to large errors in measurements with transit time (time-of-flight: TOF) ultrasonic flow meters. In those experiments, changes of pipe roughness result in the changes of PFs with certain errors. Therefore, we must take into account those effects in order to measure the flow rates of feedwater with better accuracy in actual power plants. (authors)

  7. Global Validation of MODIS Atmospheric Profile-Derived Near-Surface Air Temperature and Dew Point Estimates

    Famiglietti, C.; Fisher, J.; Halverson, G. H.

    2017-12-01

    This study validates a method of remote sensing near-surface meteorology that vertically interpolates MODIS atmospheric profiles to surface pressure level. The extraction of air temperature and dew point observations at a two-meter reference height from 2001 to 2014 yields global moderate- to fine-resolution near-surface temperature distributions that are compared to geographically and temporally corresponding measurements from 114 ground meteorological stations distributed worldwide. This analysis is the first robust, large-scale validation of the MODIS-derived near-surface air temperature and dew point estimates, both of which serve as key inputs in models of energy, water, and carbon exchange between the land surface and the atmosphere. Results show strong linear correlations between remotely sensed and in-situ near-surface air temperature measurements (R2 = 0.89), as well as between dew point observations (R2 = 0.77). Performance is relatively uniform across climate zones. The extension of mean climate-wise percent errors to the entire remote sensing dataset allows for the determination of MODIS air temperature and dew point uncertainties on a global scale.

  8. Performance of the upgraded LTP-II at the ALS Optical Metrology Laboratory

    Advanced Light Source; Yashchuk, Valeriy V; Kirschman, Jonathan L.; Domning, Edward E.; McKinney, Wayne R.; Morrison, Gregory Y.; Smith, Brian V.; Yashchuk, Valeriy V.

    2008-01-01

    The next generation of synchrotrons and free electron laser facilities requires x-ray optical systems with extremely high performance, generally of diffraction limited quality. Fabrication and use of such optics requires adequate, highly accurate metrology and dedicated instrumentation. Previously, we suggested ways to improve the performance of the Long Trace Profiler (LTP), a slope measuring instrument widely used to characterize x-ray optics at long spatial wavelengths. The main way is use of a CCD detector and corresponding technique for calibration of photo-response non-uniformity [J. L. Kirschman, et al., Proceedings of SPIE 6704, 67040J (2007)]. The present work focuses on the performance and characteristics of the upgraded LTP-II at the ALS Optical Metrology Laboratory. This includes a review of the overall aspects of the design, control system, the movement and measurement regimes for the stage, and analysis of the performance by a slope measurement of a highly curved super-quality substrate with less than 0.3 microradian (rms)slope variation

  9. 8th Brazilian Congress on Metrology (Metrologia 2015)

    2016-01-01

    THE EIGHTH BRAZILIAN CONGRESS ON METROLOGY (METROLOGIA 2015) The United Nations celebrated 2015 as the International Year of Light. By a curious coincidence, many notable events in science and technology completed a multiple of 50 or 100 years in 2015. From the pioneering work of the wise Ibn Al-Haytham in 1015, through Fresnel, Maxwell, Einstein, the discovery of the cosmic microwave background, to the use of optical fibres in communications in 1965. Electromagnetic radiation is present in our daily lives in countless applications. It is remarkable that there is no way to think about these applications without thinking of measurements. From entangled photons to more prosaic public illumination of our daily life, we are intrinsically connected all the time with the luminous phenomena. Among other things, the light allows global communication on a large scale. It strengthens the internationalization of production processes, which brings considerable changes in relations, processes and economic structures, as well as it orients the social, political and cultural behaviour of any country. These conditions of this internationalization require interchangeability of parts of complex systems, translated into strict adherence to the standards and specifications that use increasingly accurate measurement techniques, as well as the growing demand from consumer markets for products and higher quality services. They also require innovation and improvements in domestic production to boost the competitiveness of industries in domestic and foreign markets. Thus, if the Science of Measurements is taken as a serious concern, countries are better prepared to evolve towards economic and social development. In this 8"t"h edition of the Brazilian Congress on Metrology (METROLOGIA 2015), in addition to the thematic sessions in various areas of Metrology and Conformity Assessment, we hold several satellite events. They are already traditional events or highlight important current issues

  10. Control and metrology of high harmonic generation on plasma mirrors

    Monchoce, Sylvain

    2014-01-01

    When an ultra intense femtosecond laser with high contrast is focused on a solid target, the laser field at focus is sufficient enough to completely ionize the target surface during the rising edge of the laser pulse and form a plasma. This dense plasma entirely reflects the incident beam in the specular direction: this is a so-called plasma mirror. As the interaction between the laser and the plasma mirror is highly non-linear, it thus leads to the high harmonic generation (HHG) in the reflected beam. In the temporal domain, this harmonic spectrum is associated to a train of atto-second pulses. The aim of my PhD were to experimentally control this HHG and to measure the properties of the harmonics. We first studied the optimization of the harmonic signal, and then the spatial characterization of the harmonic beam in the far-field (harmonic divergence). These characterizations are not only important to develop an intense XUV/atto-second light source, but also to get a better understanding of the laser-matter interaction at very high intensity. We have thus been able to get crucial information of the electrons and ions dynamics of the plasma, showing that the harmonics can also be used as a diagnostic of the laser-plasma interaction. We then developed a new general approach for optically-controlled spatial structuring of overdense plasmas generated at the surface of initially plain solid targets. We demonstrate it experimentally by creating sinusoidal plasma gratings of adjustable spatial periodicity and depth, and study the interaction of these transient structures with an ultra-intense laser pulse to establish their usability at relativistically high intensities. We then show how these gratings can be used as a 'spatial ruler' to determine the source size of the high-order harmonic beams produced at the surface of an overdense plasma. These results open new directions both for the metrology of laser-plasma interactions and the emerging field of ultrahigh

  11. XPS and angle resolved XPS, in the semiconductor industry: Characterization and metrology control of ultra-thin films

    Brundle, C.R.; Conti, Giuseppina; Mack, Paul

    2010-01-01

    This review discusses the development of X-ray photoelectron spectroscopy, XPS, used as a characterization and metrology method for ultra-thin films in the semiconductor wafer processing industry. After a brief explanation of how the relative roles of XPS and Auger electron spectroscopy, AES, have changed over the last 15 years or so in the semiconductor industry, we go into some detail as to what is implied by metrology, as opposed to characterization, for thin films in the industry, and then describe how XPS, and particularly angle resolved XPS, ARXPS, have been implemented as a metrology 'tool' for thickness, chemical composition, and non-destructive depth profiling, of transistor gate oxide material, a key requirement in front-end processing. We take a historical approach, dealing first with the early use for SiO 2 films on Si(1 0 0), then moving to silicon oxynitride, SiO x N y in detail, and finally and briefly HfO 2 -based material, which is used today in the most advanced devices (32 nm node).

  12. CONFERENCE NOTE: European Optical Society, Topical Meeting Optical Metrology and Nanotechnology, Engelberg, Switzerland, 27 30 March 1994

    1993-01-01

    This meeting, organized by the Paul Scherrer Institute's Department of Applied Solid State Physics, will be held from 27 30 March 1994 at the Hotel Regina-Titlis, Engelberg, Switzerland. The aim is to bring together scientists from two important fields of current research and increasing industrial relevance. Optical metrology is a traditional discipline of applied optics which reached the nanometre scale a long time ago. Nanotechnology is setting new limits and represents a major challenge to metrology, as well as offering new opportunities to optics. The meeting is intended to help define a common future for optical metrology and nanotechnology. Topics to be covered include: nanometre position control and measuring techniques ultrahigh precision interferometry scanning probe microscopy (AFM, SNOM, etc.) surface modification by scanning probe methods precision surface fabrication and characterization nanolithography micro-optics, diffractive optics components, including systems and applications subwavelength optical structures synthetic optical materials structures and technologies for X-ray optics. For further information please contact: Jens Gobrecht (Secretary), Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland.Tel. (41)56992529; Fax (41) 5698 2635.

  13. X-diffraction technique applied for nano system metrology

    Kuznetsov, Alexei Yu.; Machado, Rogerio; Robertis, Eveline de; Campos, Andrea P.C.; Archanjo, Braulio S.; Gomes, Lincoln S.; Achete, Carlos A.

    2009-01-01

    The application of nano materials are fast growing in all industrial sectors, with a strong necessity in nano metrology and normalizing in the nano material area. The great potential of the X-ray diffraction technique in this field is illustrated at the example of metals, metal oxides and pharmaceuticals

  14. Information system planning work on maintenance metrological equipment

    Dmitry V. Shtoller

    2011-05-01

    Full Text Available Computerization has entered into all human activities. Important role in the work now is a workstation, which increases productivity. Did not remain without attention and work of the metrological services of enterprises. Electronic records can help solve many problems for the organization of data.

  15. Optical antennas for far and near field metrology

    Silvestri, F.; Bernal Arango, F.; Vendel, K.J.A.; Gerini, G.; Bäumer, S.M.B.; Koenderink, A.F.

    2016-01-01

    This paper presents the use of optical antennas in metrology scenarios. Two design concepts are presented: dielectric nanoresonator arrays and plasmonic nanoantennas arrays. The first ones are able to focus an incident light beam at an arbitrary focal plane. The nanoantennas arrays can be employed

  16. Accuracy and Metrological Reliability Enhancing of Thermoelectric Transducers

    Bogdan Stadnyk

    2010-12-01

    Full Text Available This article is devoted to development and use of thermoelectric thermotransducers with an enhanced accuracy and metrological reliability. The actuality of a problem is stipulated. Investigating changes at typical external environments, the mechanisms of transformation function instability are considered; possibilities of thermodynamic presentation use are analyzed concerning a thermometric substance. The algorithm of thermotransducer instrumental errors’ minimization is developed.

  17. Coherence enhanced quantum metrology in a nonequilibrium optical molecule

    Wang, Zhihai; Wu, Wei; Cui, Guodong; Wang, Jin

    2018-03-01

    We explore the quantum metrology in an optical molecular system coupled to two environments with different temperatures, using a quantum master equation beyond secular approximation. We discover that the steady-state coherence originating from and sustained by the nonequilibrium condition can enhance quantum metrology. We also study the quantitative measures of the nonequilibrium condition in terms of the curl flux, heat current and entropy production at the steady state. They are found to grow with temperature difference. However, an apparent paradox arises considering the contrary behaviors of the steady-state coherence and the nonequilibrium measures in relation to the inter-cavity coupling strength. This paradox is resolved by decomposing the heat current into a population part and a coherence part. Only the latter, the coherence part of the heat current, is tightly connected to the steady-state coherence and behaves similarly with respect to the inter-cavity coupling strength. Interestingly, the coherence part of the heat current flows from the low-temperature reservoir to the high-temperature reservoir, opposite to the direction of the population heat current. Our work offers a viable way to enhance quantum metrology for open quantum systems through steady-state coherence sustained by the nonequilibrium condition, which can be controlled and manipulated to maximize its utility. The potential applications go beyond quantum metrology and extend to areas such as device designing, quantum computation and quantum technology in general.

  18. Time-kill profiles and cell-surface morphological effects of crude ...

    MK1201 mycelial extract on the viability and cell surface morphology of methicillin-susceptible Staphylococcus aureus (MSSA) and methicillin-resistant Staphylococcus aureus (MRSA). Methods: Time-kill assays were conducted by incubating test ...

  19. Identifying drought response of semi-arid aeolian systems using near-surface luminescence profiles and changepoint analysis, Nebraska Sandhills.

    Buckland, Catherine; Bailey, Richard; Thomas, David

    2017-04-01

    Two billion people living in drylands are affected by land degradation. Sediment erosion by wind and water removes fertile soil and destabilises landscapes. Vegetation disturbance is a key driver of dryland erosion caused by both natural and human forcings: drought, fire, land use, grazing pressure. A quantified understanding of vegetation cover sensitivities and resultant surface change to forcing factors is needed if the vegetation and landscape response to future climate change and human pressure are to be better predicted. Using quartz luminescence dating and statistical changepoint analysis (Killick & Eckley, 2014) this study demonstrates the ability to identify step-changes in depositional age of near-surface sediments. Lx/Tx luminescence profiles coupled with statistical analysis show the use of near-surface sediments in providing a high-resolution record of recent system response and aeolian system thresholds. This research determines how the environment has recorded and retained sedimentary evidence of drought response and land use disturbances over the last two hundred years across both individual landforms and the wider Nebraska Sandhills. Identifying surface deposition and comparing with records of climate, fire and land use changes allows us to assess the sensitivity and stability of the surface sediment to a range of forcing factors. Killick, R and Eckley, IA. (2014) "changepoint: An R Package for Changepoint Analysis." Journal of Statistical Software, (58) 1-19.

  20. Temperature profile data from bucket, surface seawater intake, and XBT casts in a world wide distribution from 07 December 1995 to 18 October 1996 (NODC Accession 9600167)

    National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile data were collected using bucket, surface seawater intake, and XBT casts from several vessels in a world wide distribution from December 07, 1995...

  1. 7/5nm logic manufacturing capabilities and requirements of metrology

    Bunday, Benjamin; Bello, A. F.; Solecky, Eric; Vaid, Alok

    2018-03-01

    This paper will provide an update to previous works [2][4][9] to our view of the future for in-line high volume manufacturing (HVM) metrology for the semiconductor industry, concentrating on logic technology for foundries. First, we will review of the needs of patterned defect, critical dimensional (CD/3D), overlay and films metrology, and present the extensive list of applications for which metrology solutions are needed. We will then update the industry's progress towards addressing gating technical limits of the most important of these metrology solutions, highlighting key metrology technology gaps requiring industry attention and investment.

  2. Sensitivity of Landsat 8 Surface Temperature Estimates to Atmospheric Profile Data: A Study Using MODTRAN in Dryland Irrigated Systems

    Rosas, Jorge

    2017-09-26

    The land surface temperature (LST) represents a critical element in efforts to characterize global surface energy and water fluxes, as well as being an essential climate variable in its own right. Current satellite platforms provide a range of spatial and temporal resolution radiance data from which LST can be determined. One of the most complete records of data comes via the Landsat series of satellites, which provide a continuous sequence that extends back to 1982. However, for much of this time, Landsat thermal data were provided through a single broadband thermal channel, making surface temperature retrieval challenging. To fully exploit the valuable time-series of thermal information that is available from these satellites requires efforts to better describe and understand the accuracy of temperature retrievals. Here, we contribute to these efforts by examining the impact of atmospheric correction on the estimation of LST, using atmospheric profiles derived from a range of in-situ, reanalysis, and satellite data. Radiance data from the thermal infrared (TIR) sensor onboard Landsat 8 was converted to LST by using the MODTRAN version 5.2 radiative transfer model, allowing the production of an LST time series based upon 28 Landsat overpasses. LST retrievals were then evaluated against in-situ thermal measurements collected over an arid zone farmland comprising both bare soil and vegetated surface types. Atmospheric profiles derived from AIRS, MOD07, ECMWF, NCEP, and balloon-based radiosonde data were used to drive the MODTRAN simulations. In addition to examining the direct impact of using various profile data on LST retrievals, randomly distributed errors were introduced into a range of forcing variables to better understand retrieval uncertainty. Results indicated differences in LST of up to 1 K for perturbations in emissivity and profile measurements, with the analysis also highlighting the challenges in modeling aerosol optical depth (AOD) over arid lands and

  3. Sensitivity of Landsat 8 Surface Temperature Estimates to Atmospheric Profile Data: A Study Using MODTRAN in Dryland Irrigated Systems

    Rosas, Jorge; Houborg, Rasmus; McCabe, Matthew

    2017-01-01

    The land surface temperature (LST) represents a critical element in efforts to characterize global surface energy and water fluxes, as well as being an essential climate variable in its own right. Current satellite platforms provide a range of spatial and temporal resolution radiance data from which LST can be determined. One of the most complete records of data comes via the Landsat series of satellites, which provide a continuous sequence that extends back to 1982. However, for much of this time, Landsat thermal data were provided through a single broadband thermal channel, making surface temperature retrieval challenging. To fully exploit the valuable time-series of thermal information that is available from these satellites requires efforts to better describe and understand the accuracy of temperature retrievals. Here, we contribute to these efforts by examining the impact of atmospheric correction on the estimation of LST, using atmospheric profiles derived from a range of in-situ, reanalysis, and satellite data. Radiance data from the thermal infrared (TIR) sensor onboard Landsat 8 was converted to LST by using the MODTRAN version 5.2 radiative transfer model, allowing the production of an LST time series based upon 28 Landsat overpasses. LST retrievals were then evaluated against in-situ thermal measurements collected over an arid zone farmland comprising both bare soil and vegetated surface types. Atmospheric profiles derived from AIRS, MOD07, ECMWF, NCEP, and balloon-based radiosonde data were used to drive the MODTRAN simulations. In addition to examining the direct impact of using various profile data on LST retrievals, randomly distributed errors were introduced into a range of forcing variables to better understand retrieval uncertainty. Results indicated differences in LST of up to 1 K for perturbations in emissivity and profile measurements, with the analysis also highlighting the challenges in modeling aerosol optical depth (AOD) over arid lands and

  4. La Metrología Óptica y sus Aplicaciones La Metrología Óptica y sus Aplicaciones

    Daniel Malacara Hernández

    2012-01-01

    En este trabajo se presenta una introducción al campo de la metrología óptica y de su herramienta principal que es la interferometría. También se presenta un panorama de los diferentes métodos empleados en metrología describiendo con especial detalle los avances más recientes en este campo. In this work an introduction to optical metrology is presented with a brief description of its main tool which is interferometry. Also, a survey of the main different methods used in optical metrology is ...

  5. Toward reliable and repeatable automated STEM-EDS metrology with high throughput

    Zhong, Zhenxin; Donald, Jason; Dutrow, Gavin; Roller, Justin; Ugurlu, Ozan; Verheijen, Martin; Bidiuk, Oleksii

    2018-03-01

    New materials and designs in complex 3D architectures in logic and memory devices have raised complexity in S/TEM metrology. In this paper, we report about a newly developed, automated, scanning transmission electron microscopy (STEM) based, energy dispersive X-ray spectroscopy (STEM-EDS) metrology method that addresses these challenges. Different methodologies toward repeatable and efficient, automated STEM-EDS metrology with high throughput are presented: we introduce the best known auto-EDS acquisition and quantification methods for robust and reliable metrology and present how electron exposure dose impacts the EDS metrology reproducibility, either due to poor signalto-noise ratio (SNR) at low dose or due to sample modifications at high dose conditions. Finally, we discuss the limitations of the STEM-EDS metrology technique and propose strategies to optimize the process both in terms of throughput and metrology reliability.

  6. DLP-based 3D metrology by structured light or projected fringe technology for life sciences and industrial metrology

    Frankowski, G.; Hainich, R.

    2009-02-01

    Since the mid-eighties, a fundamental idea for achieving measuring accuracy in projected fringe technology was to consider the projected fringe pattern as an interferogram and evaluate it on the basis of advanced algorithms widely used for phase measuring in real-time interferometry. A fundamental requirement for obtaining a sufficiently high degree of measuring accuracy with this so-called "phase measuring projected fringe technology" is that the projected fringes, analogous to interference fringes, must have a cos2-shaped intensity distribution. Until the mid-nineties, this requirement for the projected fringe pattern measurement technology presented a basic handicap for its wide application in 3D metrology. This situation changed abruptly, when in the nineties Texas Instruments introduced to the market advanced digital light projection on the basis of micro mirror based projection systems, socalled DLP technology, which also facilitated the generation and projection of cos2-shaped intensity and/or fringe patterns. With this DLP technology, which from its original approach was actually oriented towards completely different applications such as multimedia projection, Texas Instruments boosted phase-measuring fringe projection in optical 3D metrology to a worldwide breakthrough both for medical as well as industrial applications. A subject matter of the lecture will be to present the fundamental principles and the resulting advantages of optical 3D metrology based on phase-measuring fringe projection using DLP technology. Further will be presented and discussed applications of the measurement technology in medical engineering and industrial metrology.

  7. On the appropriate definition of soil profile configuration and initial conditions for land surface-hydrology models in cold regions

    Sapriza-Azuri, Gonzalo; Gamazo, Pablo; Razavi, Saman; Wheater, Howard S.

    2018-06-01

    Arctic and subarctic regions are amongst the most susceptible regions on Earth to global warming and climate change. Understanding and predicting the impact of climate change in these regions require a proper process representation of the interactions between climate, carbon cycle, and hydrology in Earth system models. This study focuses on land surface models (LSMs) that represent the lower boundary condition of general circulation models (GCMs) and regional climate models (RCMs), which simulate climate change evolution at the global and regional scales, respectively. LSMs typically utilize a standard soil configuration with a depth of no more than 4 m, whereas for cold, permafrost regions, field experiments show that attention to deep soil profiles is needed to understand and close the water and energy balances, which are tightly coupled through the phase change. To address this gap, we design and run a series of model experiments with a one-dimensional LSM, called CLASS (Canadian Land Surface Scheme), as embedded in the MESH (Modélisation Environmentale Communautaire - Surface and Hydrology) modelling system, to (1) characterize the effect of soil profile depth under different climate conditions and in the presence of parameter uncertainty; (2) assess the effect of including or excluding the geothermal flux in the LSM at the bottom of the soil column; and (3) develop a methodology for temperature profile initialization in permafrost regions, where the system has an extended memory, by the use of paleo-records and bootstrapping. Our study area is in Norman Wells, Northwest Territories of Canada, where measurements of soil temperature profiles and historical reconstructed climate data are available. Our results demonstrate a dominant role for parameter uncertainty, that is often neglected in LSMs. Considering such high sensitivity to parameter values and dependency on the climate condition, we show that a minimum depth of 20 m is essential to adequately represent

  8. Radial dependence of surface streamer-channel luminosity: experimental evidence of Gaussian radiative profiles in Ar and N2

    Šimek, M; Ambrico, P F

    2012-01-01

    Radial distributions of electronically excited species produced during surface streamer propagation were obtained by applying the Abel inverse transform to projected luminosities of single streamers. The streamers were generated in an argon and nitrogen surface coplanar dielectric barrier discharge at atmospheric pressure and their magnified microscopic images were registered with high time resolution. Selected regions of the projected luminosities were processed by the Abel inverse transform procedure based on the Hankel–Fourier method assuming cylindrical symmetry of the streamer channel. Projected as well as Abel-inverted profiles were fitted by Gaussian functions. It is shown that the projected profiles, in addition to the Abel-inverted ones, can be well approximated by the sum of two coaxial Gaussians with two different half-widths and weights. The sharper Gaussian component with higher weight characterizes the radial dependence of the primary cathode-directed streamer-channel luminosity. The second (broader) Gaussian component probably originates either from the pre-breakdown Townsend phase or from the second wave propagating towards the anode. (paper)

  9. Analyses in zebrafish embryos reveal that nanotoxicity profiles are dependent on surface-functionalization controlled penetrance of biological membranes.

    Paatero, Ilkka; Casals, Eudald; Niemi, Rasmus; Özliseli, Ezgi; Rosenholm, Jessica M; Sahlgren, Cecilia

    2017-08-21

    Mesoporous silica nanoparticles (MSNs) are extensively explored as drug delivery systems, but in depth understanding of design-toxicity relationships is still scarce. We used zebrafish (Danio rerio) embryos to study toxicity profiles of differently surface functionalized MSNs. Embryos with the chorion membrane intact, or dechoroniated embryos, were incubated or microinjected with amino (NH 2 -MSNs), polyethyleneimine (PEI-MSNs), succinic acid (SUCC-MSNs) or polyethyleneglycol (PEG-MSNs) functionalized MSNs. Toxicity was assessed by viability and cardiovascular function. NH 2 -MSNs, SUCC-MSNs and PEG-MSNs were well tolerated, 50 µg/ml PEI-MSNs induced 100% lethality 48 hours post fertilization (hpf). Dechoroniated embryos were more sensitive and 10 µg/ml PEI-MSNs reduced viability to 5% at 96hpf. Sensitivity to PEG- and SUCC-, but not NH 2 -MSNs, was also enhanced. Typically cardiovascular toxicity was evident prior to lethality. Confocal microscopy revealed that PEI-MSNs penetrated into the embryos whereas PEG-, NH2- and SUCC-MSNs remained aggregated on the skin surface. Direct exposure of inner organs by microinjecting NH 2 -MSNs and PEI-MSNs demonstrated that the particles displayed similar toxicity indicating that functionalization affects the toxicity profile by influencing penetrance through biological barriers. The data emphasize the need for careful analyses of toxicity mechanisms in relevant models and constitute an important knowledge step towards the development of safer and sustainable nanotherapies.

  10. Hexabromocyclododecanes (HBCDDs) in surface soils from coastal cities in North China: Correlation between diastereoisomer profiles and industrial activities.

    Zhang, Yueqing; Li, Qifeng; Lu, Yonglong; Jones, Kevin; Sweetman, Andrew J

    2016-04-01

    Hexabromocyclododecane (HBCDD) is a brominated flame retardant with a wide range of industrial applications, although little is known about its patterns of spatial distribution in soils in relation to industrial emissions. This study has undertaken a large-scale investigation around an industrialized coastal area of China, exploring the concentrations, spatial distribution and diastereoisomer profiles of HBCDD in 188 surface soils from 21 coastal cities in North China. The detection frequency was 100% and concentrations of total HBCDD in the surface soils ranged from 0.123 to 363 ng g(-1) and averaged 7.20 ng g(-1), showing its ubiquitous existence at low levels. The spatial distribution of HBCDD exhibited a correlation with the location of known manufacturing facilities in Weifang, suggesting the production of HBCDD as major emission source. Diastereoisomer profiles varied in different cities. Diastereoisomer compositions in soils were compared with emissions from HBCDD industrial activities, and correlations were found between them, which has the potential for source identification. Although the contemporary concentrations of HBCDD in soils from the study were relatively low, HBCDD-containing products (expanded/extruded polystyrene insulation boards) would be a potential source after its service life, and attention needs to be paid to prioritizing large-scale waste management efforts. Copyright © 2016 Elsevier Ltd. All rights reserved.

  11. Surface analysis and depth profiling of corrosion products formed in lead pipes used to supply low alkalinity drinking water.

    Davidson, C M; Peters, N J; Britton, A; Brady, L; Gardiner, P H E; Lewis, B D

    2004-01-01

    Modern analytical techniques have been applied to investigate the nature of lead pipe corrosion products formed in pH adjusted, orthophosphate-treated, low alkalinity water, under supply conditions. Depth profiling and surface analysis have been carried out on pipe samples obtained from the water distribution system in Glasgow, Scotland, UK. X-ray diffraction spectrometry identified basic lead carbonate, lead oxide and lead phosphate as the principal components. Scanning electron microscopy/energy-dispersive x-ray spectrometry revealed the crystalline structure within the corrosion product and also showed spatial correlations existed between calcium, iron, lead, oxygen and phosphorus. Elemental profiling, conducted by means of secondary ion mass spectrometry (SIMS) and secondary neutrals mass spectrometry (SNMS) indicated that the corrosion product was not uniform with depth. However, no clear stratification was apparent. Indeed, counts obtained for carbonate, phosphate and oxide were well correlated within the depth range probed by SIMS. SNMS showed relationships existed between carbon, calcium, iron, and phosphorus within the bulk of the scale, as well as at the surface. SIMS imaging confirmed the relationship between calcium and lead and suggested there might also be an association between chloride and phosphorus.

  12. Neutron activation analysis to the profile surface sediments from several sites on the Havana Bay

    Diaz Riso, O.; Gelen, A.; Lopez, N.; Gonzalez, H.; Manso, M.V.; Graciano, A.M.; Nogueira, C.A.; Beltran, J.; Soto, J.

    2003-01-01

    Instrumental neutron activation analysis (INAA) technique was employed to analyze the surface sediments from several sites on the Havana Bay, Cuba. Measurements of heavy and trace elements in the sediments are reported. The results show that the concentration of the elements is site dependent. The data suggest that an anthropogenic input into the bay from domestic sewage and industries occurred

  13. Perfect Composition Depth Profiling of Ionic Liquid Surfaces Using High-Resolution RBS/ERDA.

    Nakajima, K.; Zolboo, E.; Ohashi, T.; Lísal, Martin; Kimura, K.

    2016-01-01

    Roč. 32, č. 10 (2016), s. 1089-1094 ISSN 0910-6340 R&D Projects: GA ČR(CZ) GA16-12291S Institutional support: RVO:67985858 Keywords : surface structure * ionic liquid * hydrogen Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 1.228, year: 2016

  14. Toe clearance and velocity profiles of young and elderly during walking on sloped surfaces

    Begg Rezaul K

    2010-04-01

    Full Text Available Abstract Background Most falls in older adults are reported during locomotion and tripping has been identified as a major cause of falls. Challenging environments (e.g., walking on slopes are potential interventions for maintaining balance and gait skills. The aims of this study were: 1 to investigate whether or not distributions of two important gait variables [minimum toe clearance (MTC and foot velocity at MTC (VelMTC] and locomotor control strategies are altered during walking on sloped surfaces, and 2 if altered, are they maintained at two groups (young and elderly female groups. Methods MTC and VelMTC data during walking on a treadmill at sloped surfaces (+3°, 0° and -3° were analysed for 9 young (Y and 8 elderly (E female subjects. Results MTC distributions were found to be positively skewed whereas VelMTC distributions were negatively skewed for both groups on all slopes. Median MTC values increased (Y = 33%, E = 7% at negative slope but decreased (Y = 25%, E = 15% while walking on the positive slope surface compared to their MTC values at the flat surface (0°. Analysis of VelMTC distributions also indicated significantly (p th percentile (Q1 values in the elderly at all slopes. Conclusion The young displayed a strong positive correlation between MTC median changes and IQR (interquartile range changes due to walking on both slopes; however, such correlation was weak in the older adults suggesting differences in control strategies being employed to minimize the risk of tripping.

  15. Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis.

    Wilde, Markus; Ohno, Satoshi; Ogura, Shohei; Fukutani, Katsuyuki; Matsuzaki, Hiroyuki

    2016-03-29

    Nuclear reaction analysis (NRA) via the resonant (1)H((15)N,αγ)(12)C reaction is a highly effective method of depth profiling that quantitatively and non-destructively reveals the hydrogen density distribution at surfaces, at interfaces, and in the volume of solid materials with high depth resolution. The technique applies a (15)N ion beam of 6.385 MeV provided by an electrostatic accelerator and specifically detects the (1)H isotope in depths up to about 2 μm from the target surface. Surface H coverages are measured with a sensitivity in the order of ~10(13) cm(-2) (~1% of a typical atomic monolayer density) and H volume concentrations with a detection limit of ~10(18) cm(-3) (~100 at. ppm). The near-surface depth resolution is 2-5 nm for surface-normal (15)N ion incidence onto the target and can be enhanced to values below 1 nm for very flat targets by adopting a surface-grazing incidence geometry. The method is versatile and readily applied to any high vacuum compatible homogeneous material with a smooth surface (no pores). Electrically conductive targets usually tolerate the ion beam irradiation with negligible degradation. Hydrogen quantitation and correct depth analysis require knowledge of the elementary composition (besides hydrogen) and mass density of the target material. Especially in combination with ultra-high vacuum methods for in-situ target preparation and characterization, (1)H((15)N,αγ)(12)C NRA is ideally suited for hydrogen analysis at atomically controlled surfaces and nanostructured interfaces. We exemplarily demonstrate here the application of (15)N NRA at the MALT Tandem accelerator facility of the University of Tokyo to (1) quantitatively measure the surface coverage and the bulk concentration of hydrogen in the near-surface region of a H2 exposed Pd(110) single crystal, and (2) to determine the depth location and layer density of hydrogen near the interfaces of thin SiO2 films on Si(100).

  16. Metrology and quality assurance for European XFEL long flat mirrors installation

    Freijo Martín, Idoia; Vannoni, Maurizio; Sinn, Harald

    2017-06-01

    The European XFEL is a large-scale user facility under construction in Hamburg, Germany. It will provide a transversally fully coherent X-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 milliseconds long pulse train at 10Hz), short wavelength (down to 0.05 nm), short pulses (in the femtoseconds scale) and high average brilliance (1.6x1025 photons / s / mm2 / mrad2/ 0.1% bandwidth)1. Due to the short wavelength and high pulse energies, mirrors need to have a high-quality surface, have to be very long (1 m), and at the same time an effective cooling system has to be implemented. Matching these tight specifications and assessing them with high precision optical measurements is very challenging. The mirrors go through a complicated and long process, starting from classical polishing to deterministic polishing, ending with a special coating and a final metrology assessment inside their mechanical mounts just before the installation. The installation itself is also difficult for such big mirrors and needs special care. In this contribution we will explain how we implemented the installation process, how we used the metrology information to optimize the installation procedure and we will show some preliminary results with the first mirrors installed in the European XFEL beam transport.

  17. International symposium on in situ nuclear metrology as a tool for radioecology INSINUME

    2008-01-01

    Full Text: This symposium, which is the natural continuation of the previous INSINUME conferences, held in Fleurus-Belgium, Albena-Bulgaria and Kusadasi-Turkey, has a dual purpose. First of all, it wants to bring together Radioecologists, Regulatory Authorities as well as Radiological Monitoring System Operators, in order to allow a wide exchange of information regarding practical experience and difficulties encountered in daily radiological monitoring of environment. On the other hand, the symposium intends to focus on the modern nuclear metrological tools, which could be used nowadays to ease the direct remote surveillance of the radiological status of seas, rivers, lakes and earth surface. In the past, these tools were suffering from a lack of sensitivity and reliability and were for that reason mainly used for health physics control that didn't require such a high accuracy. New systems are now at the disposal of the mathematical model users and radioecologists for investigating radioactive contaminants dispersion in normal conditions as well as in case of incidents. On basis of acquired experience and metrology progress, the final object of the symposium is to help the environment radioprotection world, to harmonise its rules, and thus to perform in the future a realistic and useful radiological monitoring. [fr

  18. Two small lymphocyte subpopulations in human peripheral blood. I. Purification and surface marker profiles

    Hokland, M; Hokland, P; Heron, I

    1978-01-01

    By means of simple rosette sedimentation methods two subsets from human peripheral blood lymphocytes have been isolated: (1) (E, Fc)- and (2) (E, Ig)-. The first subset was obtained by centrifuging suspensions of macrophage-depleted PBL in which E and EA rosettes had been allowed to form simultan......By means of simple rosette sedimentation methods two subsets from human peripheral blood lymphocytes have been isolated: (1) (E, Fc)- and (2) (E, Ig)-. The first subset was obtained by centrifuging suspensions of macrophage-depleted PBL in which E and EA rosettes had been allowed to form...... simultaneously. The dominant marker of these E- Fc- cells was surface Ig, and during 4 days of culture this population did not alter its surface markers. Subset 2 was obtained in two ways following rosette centrifugation with AET-treated SRBC and rabbit anti-human Ig-coated autologous RBC. This 'Null cell...

  19. Simulation of surface profile formation in oxygen laser cutting of mild steel due to combustion cycles

    Ermolaev, G V; Kovalev, O B [Khristianovich Institute of Theoretical and Applied Mechanics, Siberian Branch of Russian Academy of Sciences, Institutskaya Str 4/1, Novosibirsk, 630090 (Russian Federation)

    2009-09-21

    A physicomathematical model of cyclic iron combustion in an oxygen flow during oxygen laser cutting of metal sheets is developed. The combustion front is set into motion by focused laser radiation and a heterogeneous oxidation reaction in oxygen. The burning rate is limited by oxygen supply from the gas phase towards the metal surface, and the interface motion depends on the local temperature. A 3D numerical simulation predicts wavy structures on the metal surface; their linear sizes depend on the scanning speed of the laser beam, the thickness of the produced liquid oxide film and the parameters of the oxygen jet flow. Simulation results help in understanding the mechanism of striation formation during oxygen gas-laser cutting of mild steel and are in qualitative agreement with experimental findings.

  20. Chlorhexidine controlled-release profile after EDTA root surface etching: an in vivo study.

    Gamal, Ahmed Y; Kumper, Radi M; Sadek, Hesham S; El Destawy, Mahmoud T

    2011-05-01

    The main objective of the present study was to quantify chlorhexidine (CHX) release after the use of CHX-EDTA root surface treatment as a local-delivery antimicrobial vehicle. Twenty non-smoking patients clinically diagnosed as having moderate-to-severe chronic periodontitis were selected to participate in this study. After cause-related therapy, one site in every patient received defect overfill with CHX gel 2% (20 sites). In addition, twenty contralateral sites received defect fill of CHX gel after 3 minutes of 24% EDTA gel root surface etching (20 sites). Gingival crevicular fluid samples were collected at 1, 3, 7, and 14 days post-therapy. The CHX-EDTA group showed statistically significantly higher levels of CHX than those of the control group at 1, 3, and 7 days. At 14 days, the CHX-EDTA group showed 0.8 mg/mL values. The use of CHX-EDTA root surface treatment as a local-delivery antimicrobial improves CHX substantivity.

  1. Depositional patterns of the Mississippi Fan surface: Evidence from GLORIA II and high-resolution seismic profiles

    Twichell, David C.; Kenyon, Neil H.; Parson, Lindsay M.; McGregor, Bonnie A.

    1991-01-01

    GLORIA long-range side-scan sonar imagery and 3.5-kHz seismic-reflection profiles depict a series of nine elongate deposits with generally high-backscatter surfaces covering most of the latest fanlobe sequence of the Mississippi Fan in the eastern Gulf of Mexico. The youngest deposit is a “slump” that covers a 250 by 100 km area of the middle and upper fan. The remaining mapped deposits, termed depositional lobes, are long (as much as 200 km) and relatively thin (less than 35 m thick) bodies. Small channels and lineations on the surface of many of these depositional lobes radiate from a single, larger main channel that is the conduit through which sediment has been supplied to these surficial deposits on the fan. The 3.5-kHz profiles show that adjacent depositional lobes overlap one another rather than interfingering, indicating that only one lobe was an active site of deposition at a time. Shifting of the depositional sites appears to be caused by both aggradation and avulsion. The chronology developed from the overlapping relations indicates the oldest of the mapped depositional lobes are on the lowermost fan, and the youngest are further up the fan. Depositional lobes on the lower fan consist of a series of smaller, elongate features with high-backscatter surfaces (540 km in length) located at the ends of previously unrecognized small channels (turbidity currents and/or debris flows, sand flows, or mud flows appear to be the dominant transport process constructing these depositional lobes. Channelized flow is an important mechanism for transporting sediment away from the main channel on this fan and the resulting facies created by these small flows are laterally discontinuous.

  2. Means to verify the accuracy of CT systems for metrology applications (In the Absence of Established International Standards)

    Lettenbauer, H.; Georgi, B.; Weib, D.

    2007-01-01

    X-ray computed tomography (CT) reconstructs an unknown object from X-ray projections and has long been used for qualitative investigation of internal structures in industrial applications. Recently there has been increased interest in applying X-ray cone beam CT to the task of high-precision dimensional measurements of machined parts, since it is a relatively fast method of measuring both inner and outer geometries of arbitrary complexity. The important information for the user in dimensional metrology is if measured elements of a machined part are within the defined tolerances or not. In order to qualify cone beam CT as an established measurement technology, it must be qualified in the same manner as established measurement technologies such as coordinate measurement machines (CMMs) with tactile or optical sensors. In international standards artefacts are defined that are calibrated by certified institutions. These artefacts are defined by certain geometrical elements. CT measurements are performed on the reconstructed object volume, either directly or using an intermediate surface-extraction step. The results of these measurements have to be compared to the values of the calibrated elements; the level of agreement of the results defines the accuracy of the measurements. By using established methods to define measurement uncertainty a very high level of acceptance in dimensional metrology can be reached for the user. Only if results are comparable to standards of the established technologies the barriers of entry into metrology will be removed and all benefits of this technology will be available for the user. (authors)

  3. Metrological approach to quantitative analysis of clinical samples by LA-ICP-MS: A critical review of recent studies.

    Sajnóg, Adam; Hanć, Anetta; Barałkiewicz, Danuta

    2018-05-15

    Analysis of clinical specimens by imaging techniques allows to determine the content and distribution of trace elements on the surface of the examined sample. In order to obtain reliable results, the developed procedure should be based not only on the properly prepared sample and performed calibration. It is also necessary to carry out all phases of the procedure in accordance with the principles of chemical metrology whose main pillars are the use of validated analytical methods, establishing the traceability of the measurement results and the estimation of the uncertainty. This review paper discusses aspects related to sampling, preparation and analysis of clinical samples by laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) with emphasis on metrological aspects, i.e. selected validation parameters of the analytical method, the traceability of the measurement result and the uncertainty of the result. This work promotes the introduction of metrology principles for chemical measurement with emphasis to the LA-ICP-MS which is the comparative method that requires studious approach to the development of the analytical procedure in order to acquire reliable quantitative results. Copyright © 2018 Elsevier B.V. All rights reserved.

  4. Metrological evaluation of characterization methods applied to nuclear fuels

    Faeda, Kelly Cristina Martins; Lameiras, Fernando Soares; Camarano, Denise das Merces; Ferreira, Ricardo Alberto Neto; Migliorini, Fabricio Lima; Carneiro, Luciana Capanema Silva; Silva, Egonn Hendrigo Carvalho, E-mail: kellyfisica@gmail.co, E-mail: fernando.lameiras@pq.cnpq.b, E-mail: dmc@cdtn.b, E-mail: ranf@cdtn.b, E-mail: flmigliorini@hotmail.co, E-mail: lucsc@hotmail.co, E-mail: egonn@ufmg.b [Centro de Desenvolvimento da Tecnologia Nuclear (CDTN/CNEN-MG), Belo Horizonte, MG (Brazil)

    2010-07-01

    In manufacturing the nuclear fuel, characterizations are performed in order to assure the minimization of harmful effects. The uranium dioxide is the most used substance as nuclear reactor fuel because of many advantages, such as: high stability even when it is in contact with water at high temperatures, high fusion point, and high capacity to retain fission products. Several methods are used for characterization of nuclear fuels, such as thermogravimetric analysis for the ratio O / U, penetration-immersion method, helium pycnometer and mercury porosimetry for the density and porosity, BET method for the specific surface, chemical analyses for relevant impurities, and the laser flash method for thermophysical properties. Specific tools are needed to control the diameter and the sphericity of the microspheres and the properties of the coating layers (thickness, density, and degree of anisotropy). Other methods can also give information, such as scanning and transmission electron microscopy, X-ray diffraction, microanalysis, and mass spectroscopy of secondary ions for chemical analysis. The accuracy of measurement and level of uncertainty of the resulting data are important. This work describes a general metrological characterization of some techniques applied to the characterization of nuclear fuel. Sources of measurement uncertainty were analyzed. The purpose is to summarize selected properties of UO{sub 2} that have been studied by CDTN in a program of fuel development for Pressurized Water Reactors (PWR). The selected properties are crucial for thermalhydraulic codes to study basic design accidents. The thermal characterization (thermal diffusivity and thermal conductivity) and the penetration immersion method (density and open porosity) of UO{sub 2} samples were focused. The thermal characterization of UO{sub 2} samples was determined by the laser flash method between room temperature and 448 K. The adaptive Monte Carlo Method was used to obtain the endpoints of

  5. Loading Mode and Environment Effects on Surface Profile Characteristics of Martensite Plates in Cu-Based SMAs

    Suru, Marius-Gabriel; Paraschiv, Adrian-Liviu; Lohan, Nicoleta Monica; Pricop, Bogdan; Ozkal, Burak; Bujoreanu, Leandru-Gheorghe

    2014-07-01

    The present work reports the influence of the loading mode provided during training under constant stress, in bending, applied to lamellar specimens of Cu-Zn-Al shape memory alloys (SMAs). During training, the specimens were bent by a load fastened at their free end, while being martensitic at room temperature and they lifted the load by one-way effect (1WE), during heating up to austenitic field. On cooling to martensite field, the lower concave surface of bent specimens was compressed, and during heating it was elongated, being subjected to a series of tension-compression cycles, during heating-cooling, respectively. Conversely, the upper convex surface of bent specimens was elongated during cooling and compressed during heating, being subjected to compression-tension cycles. Furthermore, 2WE-trained actuators were tested by means of a hydraulic installation where, this time heating-cooling cycles were performed in oil conditions. Considering that the lower concave surface of the specimens was kept in compressed state, while the upper convex surface was kept in elongated state, the study reveals the influence of the two loading modes and environments on the width of martensite plates of the specimens trained under various numbers of cycles. In this purpose, Cu-Zn-Al specimens, trained under 100-300-500 cycles, were prepared and analyzed by atomic force microscopy (AFM) as well as optical and scanning electron microscopy (OM and SEM, respectively). The analysis also included AFM micrographs corroborated with statistical evaluations in order to reveal the effects of loading mode (tension or compression) in different environmental conditions of the specimens, on the surface profile characteristics of martensite plates, revealed by electropolishing.

  6. An OCD perspective of line edge and line width roughness metrology

    Bonam, Ravi; Muthinti, Raja; Breton, Mary; Liu, Chi-Chun; Sieg, Stuart; Seshadri, Indira; Saulnier, Nicole; Shearer, Jeffrey; Patlolla, Raghuveer; Huang, Huai

    2017-03-01

    Metrology of nanoscale patterns poses multiple challenges that range from measurement noise, metrology errors, probe size etc. Optical Metrology has gained a lot of significance in the semiconductor industry due to its fast turn around and reliable accuracy, particularly to monitor in-line process variations. Apart from monitoring critical dimension, thickness of films, there are multiple parameters that can be extracted from Optical Metrology models3. Sidewall angles, material compositions etc., can also be modeled to acceptable accuracy. Line edge and Line Width roughness are much sought of metrology following critical dimension and its uniformity, although there has not been much development in them with optical metrology. Scanning Electron Microscopy is still used as a standard metrology technique for assessment of Line Edge and Line Width roughness. In this work we present an assessment of Optical Metrology and its ability to model roughness from a set of structures with intentional jogs to simulate both Line edge and Line width roughness at multiple amplitudes and frequencies. We also present multiple models to represent roughness and extract relevant parameters from Optical metrology. Another critical aspect of optical metrology setup is correlation of measurement to a complementary technique to calibrate models. In this work, we also present comparison of roughness parameters extracted and measured with variation of image processing conditions on a commercially available CD-SEM tool.

  7. Improved Beam Angle Control with SPV Metrology

    Steeples, K.; Tsidilkovski, E.; Bertuch, A.; Ishida, E.; Agarwal, A.

    2008-01-01

    A method of real-time monitoring of implant angle for state-of-the-art ion implant doping in integrated circuit manufacturing has been developed using Surface Photo Voltage measurements on conventional monitor wafers. Measurement results are analyzed and compared to other techniques.

  8. Surface-seismic imaging for nehrp soil profile classifications and earthquake hazards in urban areas

    Williams, R.A.; Stephenson, W.J.; Odum, J.K.

    1998-01-01

    We acquired high-resolution seismic-refraction data on the ground surface in selected areas of the San Fernando Valley (SFV) to help explain the earthquake damage patterns and the variation in ground motion caused by the 17 January 1994 magnitude 6.7 Northridge earthquake. We used these data to determine the compressional- and shear-wave velocities (Vp and Vs) at 20 aftershock recording sites to 30-m depth ( V??s30, and V??p30). Two other sites, located next to boreholes with downhole Vp and Vs data, show that we imaged very similar seismic-vefocity structures in the upper 40 m. Overall, high site response appears to be associated with tow Vs in the near surface, but there can be a wide rangepf site amplifications for a given NEHRP soil type. The data suggest that for the SFV, if the V??s30 is known, we can determine whether the earthquake ground motion will be amplified above a factor of 2 relative to a local rock site.

  9. Proteomic Profiling of Neuroblastoma Cells Adhesion on Hyaluronic Acid-Based Surface for Neural Tissue Engineering

    Ming-Hui Yang

    2016-01-01

    Full Text Available The microenvironment of neuron cells plays a crucial role in regulating neural development and regeneration. Hyaluronic acid (HA biomaterial has been applied in a wide range of medical and biological fields and plays important roles in neural regeneration. PC12 cells have been reported to be capable of endogenous NGF synthesis and secretion. The purpose of this research was to assess the effect of HA biomaterial combining with PC12 cells conditioned media (PC12 CM in neural regeneration. Using SH-SY5Y cells as an experimental model, we found that supporting with PC12 CM enhanced HA function in SH-SY5Y cell proliferation and adhesion. Through RP-nano-UPLC-ESI-MS/MS analyses, we identified increased expression of HSP60 and RanBP2 in SH-SY5Y cells grown on HA-modified surface with cotreatment of PC12 CM. Moreover, we also identified factors that were secreted from PC12 cells and may promote SH-SY5Y cell proliferation and adhesion. Here, we proposed a biomaterial surface enriched with neurotrophic factors for nerve regeneration application.

  10. Development of the metrology and imaging of cellulose nanocrystals

    Postek, Michael T; Vladár, András; Dagata, John; Farkas, Natalia; Ming, Bin; Wagner, Ryan; Raman, Arvind; Moon, Robert J; Sabo, Ronald; Wegner, Theodore H; Beecher, James

    2011-01-01

    The development of metrology for nanoparticles is a significant challenge. Cellulose nanocrystals (CNCs) are one group of nanoparticles that have high potential economic value but present substantial challenges to the development of the measurement science. Even the largest trees owe their strength to this newly appreciated class of nanomaterials. Cellulose is the world's most abundant natural, renewable, biodegradable polymer. Cellulose occurs as whisker-like microfibrils that are biosynthesized and deposited in plant material in a continuous fashion. The nanocrystals are isolated by hydrolyzing away the amorphous segments leaving the acid resistant crystalline fragments. Therefore, the basic raw material for new nanomaterial products already abounds in nature and is available to be utilized in an array of future materials. However, commercialization requires the development of efficient manufacturing processes and nanometrology to monitor quality. This paper discusses some of the instrumentation, metrology and standards issues associated with the ramping up for production and use of CNCs

  11. Development of the metrology and imaging of cellulose nanocrystals

    Postek, Michael T.; Vladár, András; Dagata, John; Farkas, Natalia; Ming, Bin; Wagner, Ryan; Raman, Arvind; Moon, Robert J.; Sabo, Ronald; Wegner, Theodore H.; Beecher, James

    2011-02-01

    The development of metrology for nanoparticles is a significant challenge. Cellulose nanocrystals (CNCs) are one group of nanoparticles that have high potential economic value but present substantial challenges to the development of the measurement science. Even the largest trees owe their strength to this newly appreciated class of nanomaterials. Cellulose is the world's most abundant natural, renewable, biodegradable polymer. Cellulose occurs as whisker-like microfibrils that are biosynthesized and deposited in plant material in a continuous fashion. The nanocrystals are isolated by hydrolyzing away the amorphous segments leaving the acid resistant crystalline fragments. Therefore, the basic raw material for new nanomaterial products already abounds in nature and is available to be utilized in an array of future materials. However, commercialization requires the development of efficient manufacturing processes and nanometrology to monitor quality. This paper discusses some of the instrumentation, metrology and standards issues associated with the ramping up for production and use of CNCs.

  12. Development of ITER in-vessel viewing and metrology systems

    Obara, Kenjiro; Kakudate, Satoshi; Nakahira, Masataka; Ito, Akira [Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment

    1998-04-01

    The ITER in-vessel viewing system is vital for detecting and locating damage to in-vessel components such as the blankets and divertors and in monitoring and assisting in-vessel maintenance. This system must be able to operate at high temperature (200degC) under intense gamma radiation ({approx}30 kGy/h) in a high vacuum or 1 bar inert gas. A periscope viewing system was chosen as a reference due to its clear, wide view and a fiberscope viewing system chosen as a backup for viewing in narrow confines. According to the ITER R and D program, both systems and a metrology system are being developed through the joint efforts of Japan, the U.S., and RF Home Teams. This paper outlines design and technology development mainly on periscope in-vessel viewing and laser metrology contributed by the Japan Home Team. (author)

  13. Development of ITER in-vessel viewing and metrology systems

    Obara, Kenjiro; Kakudate, Satoshi; Nakahira, Masataka; Ito, Akira

    1998-01-01

    The ITER in-vessel viewing system is vital for detecting and locating damage to in-vessel components such as the blankets and divertors and in monitoring and assisting in-vessel maintenance. This system must be able to operate at high temperature (200degC) under intense gamma radiation (∼30 kGy/h) in a high vacuum or 1 bar inert gas. A periscope viewing system was chosen as a reference due to its clear, wide view and a fiberscope viewing system chosen as a backup for viewing in narrow confines. According to the ITER R and D program, both systems and a metrology system are being developed through the joint efforts of Japan, the U.S., and RF Home Teams. This paper outlines design and technology development mainly on periscope in-vessel viewing and laser metrology contributed by the Japan Home Team. (author)

  14. Nonlinear Quantum Metrology of Many-Body Open Systems

    Beau, M.; del Campo, A.

    2017-07-01

    We introduce general bounds for the parameter estimation error in nonlinear quantum metrology of many-body open systems in the Markovian limit. Given a k -body Hamiltonian and p -body Lindblad operators, the estimation error of a Hamiltonian parameter using a Greenberger-Horne-Zeilinger state as a probe is shown to scale as N-[k -(p /2 )], surpassing the shot-noise limit for 2 k >p +1 . Metrology equivalence between initial product states and maximally entangled states is established for p ≥1 . We further show that one can estimate the system-environment coupling parameter with precision N-(p /2 ), while many-body decoherence enhances the precision to N-k in the noise-amplitude estimation of a fluctuating k -body Hamiltonian. For the long-range Ising model, we show that the precision of this parameter beats the shot-noise limit when the range of interactions is below a threshold value.

  15. Metrology for industrial quantum communications: the MIQC project

    Rastello, M. L.; Degiovanni, I. P.; Sinclair, A. G.; Kück, S.; Chunnilall, C. J.; Porrovecchio, G.; Smid, M.; Manoocheri, F.; Ikonen, E.; Kubarsepp, T.; Stucki, D.; Hong, K. S.; Kim, S. K.; Tosi, A.; Brida, G.; Meda, A.; Piacentini, F.; Traina, P.; Natsheh, A. Al; Cheung, J. Y.; Müller, I.; Klein, R.; Vaigu, A.

    2014-12-01

    The ‘Metrology for Industrial Quantum Communication Technologies’ project (MIQC) is a metrology framework that fosters development and market take-up of quantum communication technologies and is aimed at achieving maximum impact for the European industry in this area. MIQC is focused on quantum key distribution (QKD) technologies, the most advanced quantum-based technology towards practical application. QKD is a way of sending cryptographic keys with absolute security. It does this by exploiting the ability to encode in a photon's degree of freedom specific quantum states that are noticeably disturbed if an eavesdropper trying to decode it is present in the communication channel. The MIQC project has started the development of independent measurement standards and definitions for the optical components of QKD system, since one of the perceived barriers to QKD market success is the lack of standardization and quality assurance.

  16. Characteristics of the radiation prevention metrology laboratory 'Cajavec' - Banjaluka

    Tomljenovic, I.; Ninkovic, M.; Kolonic, Dz.

    2004-01-01

    Radiation metrology laboratory built in the factory 'Cajavec' in Banja Luka, planed for gauge the detectors of ionization radiation. Laboratory as part of the large factory building , thus projected and formed according to positive radiation principles. Walls are constructed of basic concrete, main entrance of lead, approaching the radiation bench from the back side. Sound and light signal system connected with dosemeter for showing mini dose of radiation creating conditions for safe work of the dosemeterists. (author) [sr

  17. Clean focus, dose and CD metrology for CD uniformity improvement

    Lee, Honggoo; Han, Sangjun; Hong, Minhyung; Kim, Seungyoung; Lee, Jieun; Lee, DongYoung; Oh, Eungryong; Choi, Ahlin; Kim, Nakyoon; Robinson, John C.; Mengel, Markus; Pablo, Rovira; Yoo, Sungchul; Getin, Raphael; Choi, Dongsub; Jeon, Sanghuck

    2018-03-01

    Lithography process control solutions require more exacting capabilities as the semiconductor industry goes forward to the 1x nm node DRAM device manufacturing. In order to continue scaling down the device feature sizes, critical dimension (CD) uniformity requires continuous improvement to meet the required CD error budget. In this study we investigate using optical measurement technology to improve over CD-SEM methods in focus, dose, and CD. One of the key challenges is measuring scanner focus of device patterns. There are focus measurement methods based on specially designed marks on scribe-line, however, one issue of this approach is that it will report focus of scribe line which is potentially different from that of the real device pattern. In addition, scribe-line marks require additional design and troubleshooting steps that add complexity. In this study, we investigated focus measurement directly on the device pattern. Dose control is typically based on using the linear correlation behavior between dose and CD. The noise of CD measurement, based on CD-SEM for example, will not only impact the accuracy, but also will make it difficult to monitor dose signature on product wafers. In this study we will report the direct dose metrology result using an optical metrology system which especially enhances the DUV spectral coverage to improve the signal to noise ratio. CD-SEM is often used to measure CD after the lithography step. This measurement approach has the advantage of easy recipe setup as well as the flexibility to measure critical feature dimensions, however, we observe that CD-SEM metrology has limitations. In this study, we demonstrate within-field CD uniformity improvement through the extraction of clean scanner slit and scan CD behavior by using optical metrology.

  18. Innovative Ge Quantum Dot Functional Sensing and Metrology Devices

    2017-08-21

    Sensing/Metrology Devices Period: May 26th 2015May 25th 2017 Investigators: Pei-Wen Li Affiliation: Department of Electrical Engineering , National...light sources as well as low-power, high-speed Ge photodetectors indeed requires the growth of direct-gap Ge, heterostructure engineering for...All these tasks cannot be simply conducted in terms of bulk Ge technology, and it is no doubt that nanoscience and nanotechnology would offer

  19. Metrology and Proportion in the Ecclesiastical Architecture of Medieval Ireland

    Behan, Avril; Moss, Rachel

    2008-01-01

    The aim of this paper is to examine the extent to which detailed empirical analysis of the metrology and proportional systems used in the design of Irish ecclesiastical architecture can be analysed to provide historical information not otherwise available. Focussing on a relatively limited sample of window tracery designs as a case study, it will first set out to establish what, if any, systems were in use, and then what light these might shed on the background, training and work practices of...

  20. A blueprint for radioanalytical metrology CRMs, intercomparisons, and PE

    Inn, Kenneth G.W.; Kurosaki, Hiromu; Frechou, Carole; Gilligan, Chris; Jones, Robert; LaMont, Stephen; Leggitt, Jeff; Li Chunsheng; McCroan, Keith; Swatski, Ronald

    2008-01-01

    A workshop was held from 28 February to 2 March 2006 at the National Institute of Standards and Technology (NIST) to evaluate the needs for new directions for complex matrix reference materials certified for radionuclide content, interlaboratory comparisons and performance evaluation (PE) programs. The workshop identified new radioanalytical metrology thrust areas needed for environmental, radiobioassay, emergency consequence management, and nuclear forensics, attribution, nonproliferation, and safeguards

  1. Overlay improvement methods with diffraction based overlay and integrated metrology

    Nam, Young-Sun; Kim, Sunny; Shin, Ju Hee; Choi, Young Sin; Yun, Sang Ho; Kim, Young Hoon; Shin, Si Woo; Kong, Jeong Heung; Kang, Young Seog; Ha, Hun Hwan

    2015-03-01

    To accord with new requirement of securing more overlay margin, not only the optical overlay measurement is faced with the technical limitations to represent cell pattern's behavior, but also the larger measurement samples are inevitable for minimizing statistical errors and better estimation of circumstance in a lot. From these reasons, diffraction based overlay (DBO) and integrated metrology (IM) were mainly proposed as new approaches for overlay enhancement in this paper.

  2. Lectin binding profiles of SSEA-4 enriched, pluripotent human embryonic stem cell surfaces

    Venable, Alison; Mitalipova, Maisam; Lyons, Ian; Jones, Karen; Shin, Soojung; Pierce, Michael; Stice, Steven

    2005-01-01

    Background Pluripotent human embryonic stem cells (hESCs) have the potential to form every cell type in the body. These cells must be appropriately characterized prior to differentiation studies or when defining characteristics of the pluripotent state. Some developmentally regulated cell surface antigens identified by monoclonal antibodies in a variety of species and stem cell types have proven to be side chains of membrane glycolipids and glycoproteins. Therefore, to examine hESC surfaces for other potential pluripotent markers, we used a panel of 14 lectins, which were chosen based on their specificity for a variety of carbohydrates and carbohydrate linkages, along with stage specific embryonic antigen-4 (SSEA-4), to determine binding quantitation by flow cytometry and binding localization in adherent colonies by immunocytochemistry. Results Enriching cells for SSEA-4 expression increased the percentage of SSEA-4 positive cells to 98–99%. Using enriched high SSEA-4-expressing hESCs, we then analyzed the binding percentages of selected lectins and found a large variation in binding percentages ranging from 4% to 99% binding. Lycopersicon (tomato)esculetum lectin (TL), Ricinus communis agglutinin (RCA), and Concanavalin A (Con A) bound to SSEA-4 positive regions of hESCs and with similar binding percentages as SSEA-4. In contrast, we found Dolichos biflorus agglutinin (DBA) and Lotus tetragonolobus lectin (LTL) did not bind to hESCs while Phaseolus vulgaris leuco-agglutinin (PHA-L), Vicia villosa agglutinin (VVA), Ulex europaeus agglutinin (UEA), Phaseolus vulgaris erythro-agglutinin (PHA-E), and Maackia amurensis agglutinin (MAA) bound partially to hESCs. These binding percentages correlated well with immunocytochemistry results. Conclusion Our results provide information about types of carbohydrates and carbohydrate linkages found on pluripotent hESC surfaces. We propose that TL, RCA and Con A may be used as markers that are associated with the pluripotent

  3. Lectin binding profiles of SSEA-4 enriched, pluripotent human embryonic stem cell surfaces

    Shin Soojung

    2005-07-01

    Full Text Available Abstract Background Pluripotent human embryonic stem cells (hESCs have the potential to form every cell type in the body. These cells must be appropriately characterized prior to differentiation studies or when defining characteristics of the pluripotent state. Some developmentally regulated cell surface antigens identified by monoclonal antibodies in a variety of species and stem cell types have proven to be side chains of membrane glycolipids and glycoproteins. Therefore, to examine hESC surfaces for other potential pluripotent markers, we used a panel of 14 lectins, which were chosen based on their specificity for a variety of carbohydrates and carbohydrate linkages, along with stage specific embryonic antigen-4 (SSEA-4, to determine binding quantitation by flow cytometry and binding localization in adherent colonies by immunocytochemistry. Results Enriching cells for SSEA-4 expression increased the percentage of SSEA-4 positive cells to 98–99%. Using enriched high SSEA-4-expressing hESCs, we then analyzed the binding percentages of selected lectins and found a large variation in binding percentages ranging from 4% to 99% binding. Lycopersicon (tomatoesculetum lectin (TL, Ricinus communis agglutinin (RCA, and Concanavalin A (Con A bound to SSEA-4 positive regions of hESCs and with similar binding percentages as SSEA-4. In contrast, we found Dolichos biflorus agglutinin (DBA and Lotus tetragonolobus lectin (LTL did not bind to hESCs while Phaseolus vulgaris leuco-agglutinin (PHA-L, Vicia villosa agglutinin (VVA, Ulex europaeus agglutinin (UEA, Phaseolus vulgaris erythro-agglutinin (PHA-E, and Maackia amurensis agglutinin (MAA bound partially to hESCs. These binding percentages correlated well with immunocytochemistry results. Conclusion Our results provide information about types of carbohydrates and carbohydrate linkages found on pluripotent hESC surfaces. We propose that TL, RCA and Con A may be used as markers that are associated with the

  4. Multiplex flow cytometry barcoding and antibody arrays identify surface antigen profiles of primary and metastatic colon cancer cell lines.

    Kumar Sukhdeo

    Full Text Available Colon cancer is a deadly disease affecting millions of people worldwide. Current treatment challenges include management of disease burden as well as improvements in detection and targeting of tumor cells. To identify disease state-specific surface antigen signatures, we combined fluorescent cell barcoding with high-throughput flow cytometric profiling of primary and metastatic colon cancer lines (SW480, SW620, and HCT116. Our multiplexed technique offers improvements over conventional methods by permitting the simultaneous and rapid screening of cancer cells with reduced effort and cost. The method uses a protein-level analysis with commercially available antibodies on live cells with intact epitopes to detect potential tumor-specific targets that can be further investigated for their clinical utility. Multiplexed antibody arrays can easily be applied to other tumor types or pathologies for discovery-based approaches to target identification.

  5. Analytical model of surface potential profiles and transfer characteristics for hetero stacked tunnel field-effect transistors

    Xu, Hui Fang; Sun, Wen; Han, Xin Feng

    2018-06-01

    An analytical model of surface potential profiles and transfer characteristics for hetero stacked tunnel field-effect transistors (HS-TFETs) is presented for the first time, where hetero stacked materials are composed of two different bandgaps. The bandgap of the underlying layer is smaller than that of the upper layer. Under different device parameters (upper layer thickness, underlying layer thickness, and hetero stacked materials) and temperature, the validity of the model is demonstrated by the agreement of its results with the simulation results. Moreover, the results show that the HS-TFETs can obtain predominant performance with relatively slow changes of subthreshold swing (SS) over a wide drain current range, steep average subthreshold swing, high on-state current, and large on–off state current ratio.

  6. World wide matching of registration metrology tools of various generations

    Laske, F.; Pudnos, A.; Mackey, L.; Tran, P.; Higuchi, M.; Enkrich, C.; Roeth, K.-D.; Schmidt, K.-H.; Adam, D.; Bender, J.

    2008-10-01

    Turn around time/cycle time is a key success criterion in the semiconductor photomask business. Therefore, global mask suppliers typically allocate work loads based on fab capability and utilization capacity. From a logistical point of view, the manufacturing location of a photomask should be transparent to the customer (mask user). Matching capability of production equipment and especially metrology tools is considered a key enabler to guarantee cross site manufacturing flexibility. Toppan, with manufacturing sites in eight countries worldwide, has an on-going program to match the registration metrology systems of all its production sites. This allows for manufacturing flexibility and risk mitigation.In cooperation with Vistec Semiconductor Systems, Toppan has recently completed a program to match the Vistec LMS IPRO systems at all production sites worldwide. Vistec has developed a new software feature which allows for significantly improved matching of LMS IPRO(x) registration metrology tools of various generations. We will report on the results of the global matching campaign of several of the leading Toppan sites.

  7. An active pixels spectrometers for neutronic fields metrology

    Taforeau, Julien

    2013-01-01

    The fundamental metrology is responsible for the sustainability of the measurement systems and handles to supply the reference standards. Concerning the metrology of ionizing radiations and, in particular the neutron metrology, detectors standards are used to characterize reference fields, in terms of energy and fluence. The dosimeters or particle detectors are calibrated on these reference fields. This thesis presents the development of a neutron spectrometer neutron candidate to the status of primary standard for the characterization of neutron fields in the range from 5 to 20 MeV. The spectrometer uses the recoil proton telescope as detection principle; the CMOS technology, through three sensor positions, is taking advantage to realize the tracking of protons. A Si(Li) detector handles the measure of the residual proton energy. The device simulations, realized under MCNPX, allow to estimate its performances and to validate the neutron energy reconstruction. An essential step of characterization of the telescope elements and in particular of CMOS sensors is also proposed to guarantee the validity of posterior experimental measurements. The tests realized as well in mono-energy fields as in radionuclide source show the very good performances of the system. The quantification of uncertainties indicates an energy estimation with 1.5 % accuracy and a resolution of less than 6 %. The fluence measurement is performed with an uncertainty about 4 to 6%. (author)

  8. The Remarkable Metrological History of Radiocarbon Dating [II].

    Currie, Lloyd A

    2004-01-01

    This article traces the metrological history of radiocarbon, from the initial breakthrough devised by Libby, to minor (evolutionary) and major (revolutionary) advances that have brought (14)C measurement from a crude, bulk [8 g carbon] dating tool, to a refined probe for dating tiny amounts of precious artifacts, and for "molecular dating" at the 10 µg to 100 µg level. The metrological advances led to opportunities and surprises, such as the non-monotonic dendrochronological calibration curve and the "bomb effect," that gave rise to new multidisciplinary areas of application, ranging from archaeology and anthropology to cosmic ray physics to oceanography to apportionment of anthropogenic pollutants to the reconstruction of environmental history. Beyond the specific topic of natural (14)C, it is hoped that this account may serve as a metaphor for young scientists, illustrating that just when a scientific discipline may appear to be approaching maturity, unanticipated metrological advances in their own chosen fields, and unanticipated anthropogenic or natural chemical events in the environment, can spawn new areas of research having exciting theoretical and practical implications.

  9. The future of 2D metrology for display manufacturing

    Sandstrom, Tor; Wahlsten, Mikael; Park, Youngjin

    2016-10-01

    The race to 800 PPI and higher in mobile devices and the transition to OLED displays are driving a dramatic development of mask quality: resolution, CDU, registration, and complexity. 2D metrology for large area masks is necessary and must follow the roadmap. Driving forces in the market place point to continued development of even more dense displays. State-of-the-art metrology has proven itself capable of overlay below 40 nm and registration below 65 nm for G6 masks. Future developments include incoming and recurrent measurements of pellicalized masks at the panel maker's factory site. Standardization of coordinate systems across supplier networks is feasible. This will enable better yield and production economy for both mask and panel maker. Better distortion correction methods will give better registration on the panels and relax the flatness requirements of the mask blanks. If panels are measured together with masks and the results are used to characterize the aligners, further quality and yield improvements are possible. Possible future developments include in-cell metrology and integration with other instruments in the same platform.

  10. Experimental realization of the quantum metrological triangle experiment

    Chenaud, B; Devoille, L; Steck, B; Feltin, N; Gonzalez-Cano, A; Poirier, W; Schopfer, F; Spengler, G; Djordjevic, S; Seron, O; Piquemal, F [Laboratoire national de metrologie et d' essais (LNE), Trappes (France); Lotkhov, S [Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany)], E-mail: laurent.devoille@lne.fr

    2009-02-01

    The quantum metrological triangle experiment (QMTE) consists in realizing Ohm's law with Josephson (JE), quantum Hall (QHE) and single electron tunneling (SET) effects. The aim is to check the consistency of the link among the phenomenological constants K {sub J}, R{sub K} and Q {sub X} involved in these effects and theoretically expressed with the fundamental constants e and h. Such an experiment could be a contribution for a new definition of the systeme international d'unites (SI) base units. In the QMTE, a current generated by a SET device flows through a resistor calibrated against QHE standard and the voltage induced at its terminals is compared to the metrological voltage generated by a Josephson junctions array. At LNE, the studied SET devices are 3 junctions single electron pumps with on chip resistors. The quantized current generated by this pump is theoretically equal to ef (f is the frequency of the driving signals applied on the gates) and is measured through a cryogenic current comparator (CCC), which allows to amplify the low pumping current with a metrological accuracy. We will present and discuss the experimental set-up developed at LNE and the first results. In addition to the main aim of QMTE described above, these preliminary results are also a first step towards a determination of e.

  11. Relativistic quantum metrology: exploiting relativity to improve quantum measurement technologies.

    Ahmadi, Mehdi; Bruschi, David Edward; Sabín, Carlos; Adesso, Gerardo; Fuentes, Ivette

    2014-05-22

    We present a framework for relativistic quantum metrology that is useful for both Earth-based and space-based technologies. Quantum metrology has been so far successfully applied to design precision instruments such as clocks and sensors which outperform classical devices by exploiting quantum properties. There are advanced plans to implement these and other quantum technologies in space, for instance Space-QUEST and Space Optical Clock projects intend to implement quantum communications and quantum clocks at regimes where relativity starts to kick in. However, typical setups do not take into account the effects of relativity on quantum properties. To include and exploit these effects, we introduce techniques for the application of metrology to quantum field theory. Quantum field theory properly incorporates quantum theory and relativity, in particular, at regimes where space-based experiments take place. This framework allows for high precision estimation of parameters that appear in quantum field theory including proper times and accelerations. Indeed, the techniques can be applied to develop a novel generation of relativistic quantum technologies for gravimeters, clocks and sensors. As an example, we present a high precision device which in principle improves the state-of-the-art in quantum accelerometers by exploiting relativistic effects.

  12. Metrological traceability of carbon dioxide measurements in atmosphere and seawater

    Rolle, F; Pessana, E; Sega, M

    2017-01-01

    The accurate determination of gaseous pollutants is fundamental for the monitoring of the trends of these analytes in the environment and the application of the metrological concepts to this field is necessary to assure the reliability of the measurement results. In this work, an overview of the activity carried out at Istituto Nazionale di Ricerca Metrologica to establish the metrological traceability of the measurements of gaseous atmospheric pollutants, in particular of carbon dioxide (CO 2 ), is presented. Two primary methods, the gravimetry and the dynamic dilution, are used for the preparation of reference standards for composition which can be used to calibrate sensors and analytical instrumentation. At present, research is carried out to lower the measurement uncertainties of the primary gas mixtures and to extend their application to the oceanic field. The reason of such investigation is due to the evidence of the changes occurring in seawater carbonate chemistry, connected to the rising level of CO 2 in the atmosphere. The well established activity to assure the metrological traceability of CO 2 in the atmosphere will be applied to the determination of CO 2 in seawater, by developing suitable reference materials for calibration and control of the sensors during their routine use. (paper)

  13. Catastrophe Optics Method to Determine the Micro-Nano Size Profiles at TPL of Liquid Films on a Solid Surface

    Chao, David F.; McQuillen, J. B.; Sankovic, J. M.; Zhang, Nengli

    2009-01-01

    As discovered by recent studies, what directly affects the wetting and spreading is curvature in micro-region rather than the macroscopic contact angle. Measuring the profile of the micro-region becomes an important research topic. Recently, catastrophe optics has been applied to this kind of measurements. Optical catastrophe occurring in far field of waves of liquid-refracted laser beam implies a wealth of information about the liquid spreading not only for liquid drops but also for films. When a parallel laser beam passes through a liquid film on a slide glass at three-phase-line (TPL), very interesting optical image patterns occur on a screen far from the film. An analysis based on catastrophe optics discloses and interprets the formation of these optical image patterns. The analysis reveals that the caustic line manifested as the bright-thick line on the screen implies the lowest hierarchy of optical catastrophes, called fold caustic. This optical catastrophe is produced by the inflexion line on liquid surface at the liquid foot, which is formed not only in the spreading of drops but also in spreading of films. The generalized catastrophe optics method enables to identify the edge profiles and determine the edge foot height of liquid films. Keywords: Crossover region, Inflexion line, liquid edge foot, Catastrophe optics, Caustic and diffraction

  14. Near-Surface Profiles of Water Stable Isotope Components and Indicated Transitional History of Ice-Wedge Polygons Near Barrow

    Iwahana, G.; Wilson, C.; Newman, B. D.; Heikoop, J. M.; Busey, R.

    2017-12-01

    Wetlands associated with ice-wedge polygons are commonly distributed across the Arctic Coastal Plain of northern Alaska, a region underlain by continuous permafrost. Micro-topography of the ice-wedge polygons controls local hydrology, and the micro-topography could be altered due to factors such like surface vegetation, wetness, freeze-thaw cycles, and permafrost degradation/aggradation under climate change. Understanding status of the wetlands in the near future is important because it determines biogeochemical cycle, which drives release of greenhouse gases from the ground. However, transitional regime of the ice-wedge polygons under the changing climate is not fully understood. In this study, we analyzed geochemistry of water extracted from frozen soil cores sampled down to about 1m depth in 2014 March at NGEE-Arctic sites in the Barrow Environmental Observatory. The cores were sampled from troughs/rims/centers of five different low-centered or flat-centered polygons. The frozen cores are divided into 5-10cm cores for each location, thawed in sealed plastic bags, and then extracted water was stored in vials. Comparison between the profiles of geochemistry indicated connection of soil water in the active layer at different location in a polygon, while it revealed that distinctly different water has been stored in permafrost layer at troughs/rims/centers of some polygons. Profiles of volumetric water content (VWC) showed clear signals of freeze-up desiccation in the middle of saturated active layers as low VWC anomalies at most sampling points. Water in the active layer and near-surface permafrost was classified into four categories: ice wedge / fresh meteoric / transitional / highly fractionated water. The overall results suggested prolonged separation of water in the active layer at the center of low-centered polygons without lateral connection in water path in the past.

  15. Predicting the impact of vegetations in open channels with different distributaries' operations on water surface profile using artificial neural networks

    Abdeen, Mostafa A. M.

    2008-01-01

    Most of the open water irrigation channels in Egypt suffer from the infestation of aquatic weeds, especially the submerged ones that cause numerous hydraulic problems for the open channels themselves and their water distributaries such as increasing water losses, obstructing water flow, and reducing channels' water distribution efficiencies. Accurate simulation and prediction of flow behavior in such channels is very essential for water distribution decision makers. Artificial neural networks (ANN) have proven to be very successful in the simulation of several physical phenomena, in general, and in the water research field in particular. Therefore, the current study aims towards introducing the utilization of ANN in simulating the impact of vegetation in main open channel, which supplies water to different distributaries, on the water surface profile in this main channel. Specifically, the study, presented in the current paper utilizes ANN technique for the development of various models to simulate the impact of different submerged weeds' densities, different flow discharges, and different distributaries operation scheduling on the water surface profile in an experimental main open channel that supplies water to different distributaries. In the investigated experiment, the submerged weeds were simulated as branched flexible elements. The investigated experiment was considered as an example for implementing the same methodology and technique in a real open channel system. The results showed that the ANN technique is very successful in simulating the flow behavior of the pre-mentioned open channel experiment with the existence of the submerged weeds. In addition, the developed ANN models were capable of predicting the open channel flow behavior in all the submerged weeds' cases that were considered in the ANN development process

  16. Influence of Surface-profile and Movement-path of Roller on Thickness Thinning during Multi-pass Deep Drawing Spinning

    Xia Qinxiang

    2016-01-01

    Full Text Available Over thinning is a serious defect influencing the forming quality of spun workpiece during multi-pass deep drawing spinning. Surface-profile and movement-path of roller are the key factors influencing the thinning ratio of wall thickness of spun workpiece. The influence of surface-profile and movement-path of roller on thickness thinning were studied based on numerical simulation and experimental research, four groups of forming experiments were carried out under the combination of the different surface-profile of roller (R12 and R25-12 and movement-path of roller (spinning from the bottom of the blank and spinning from the middle of the blank. The results show that both the surface-profile and movement-path of roller have great influence on wall thickness thinning during multi-pass deep drawing spinning; and compared with the movement-path of roller, the influence of surface-profile of roller is more significant. The experimental results conform well to the simulation ones. It indicates that the FEA model established is reasonable and reliable.

  17. Aroma profile design of wine spirits: Multi-objective optimization using response surface methodology.

    Matias-Guiu, Pau; Rodríguez-Bencomo, Juan José; Pérez-Correa, José R; López, Francisco

    2018-04-15

    Developing new distillation strategies can help the spirits industry to improve quality, safety and process efficiency. Batch stills equipped with a packed column and an internal partial condenser are an innovative experimental system, allowing a fast and flexible management of the rectification. In this study, the impact of four factors (heart-cut volume, head-cut volume, pH and cooling flow rate of the internal partial condenser during the head-cut fraction) on 18 major volatile compounds of Muscat spirits was optimized using response surface methodology and desirability function approaches. Results have shown that high rectification at the beginning of the heart-cut enhances the overall positive aroma compounds of the product, reducing off-flavor compounds. In contrast, optimum levels of heart-cut volume, head-cut volume and pH factors varied depending on the process goal. Finally, three optimal operational conditions (head off-flavors reduction, flowery terpenic enhancement and fruity ester enhancement) were evaluated by chemical and sensory analysis. Copyright © 2017 Elsevier Ltd. All rights reserved.

  18. Characterization of Drain Surface Water: Environmental Profile, Degradation Level and Geo-statistic Monitoring

    Mumtaz, M.W.; Raza, M.A.; Ahmed, Z.; Abbas, M.N.; Hussain, M.

    2015-01-01

    The physico-chemical characterization of the surface water. Samples was carried out collected from nine sampling points of drain passing by the territory of Hafizabad city, Punjab, Pakistan. The water of drain is used by farmers for irrigation purposes in nearby agricultural fields. Twenty water quality parameters were evaluated in three turns and the results obtained were compared with the National Environmental Quality Standards (NEQS) municipal and industrial effluents prescribed limits. The highly significant difference (p<0.01) was recorded for the content of phenols, carbonyl compounds, cyanides, dissolved oxygen, biological oxygen demand, total soluble salts, total dissolved salts, nitrates and sulphates, whereas, the concentration of magnesium, potassium and oil and grease differed significantly (p<0.05) with respect to the sampling points on average basis. Non-significant difference (p>0.05) was noted for temperature, pH, electrical conductivity, hardness, calcium, sodium, chemical oxygen demand and chloride among water samples from different sampling points. Furthermore, the experimental results of different water quality parameters studied at nine sampling points of the drain were used and interpolated in ArcGIS 9.3 environment system using kriging techniques to obtain calculated values for the remaining locations of the Drain. (author)

  19. Vertical profiles of lung deposited surface area concentration of particulate matter measured with a drone in a street canyon.

    Kuuluvainen, Heino; Poikkimäki, Mikko; Järvinen, Anssi; Kuula, Joel; Irjala, Matti; Dal Maso, Miikka; Keskinen, Jorma; Timonen, Hilkka; Niemi, Jarkko V; Rönkkö, Topi

    2018-05-23

    The vertical profiles of lung deposited surface area (LDSA) concentration were measured in an urban street canyon in Helsinki, Finland, by using an unmanned aerial system (UAS) as a moving measurement platform. The street canyon can be classified as an avenue canyon with an aspect ratio of 0.45 and the UAS was a multirotor drone especially modified for emission measurements. In the experiments of this study, the drone was equipped with a small diffusion charge sensor capable of measuring the alveolar LDSA concentration of particles. The drone measurements were conducted during two days on the same spatial location at the kerbside of the street canyon by flying vertically from the ground level up to an altitude of 50 m clearly above the rooftop level (19 m) of the nearest buildings. The drone data were supported by simultaneous measurements and by a two-week period of measurements at nearby locations with various instruments. The results showed that the averaged LDSA concentrations decreased approximately from 60 μm 2 /cm 3 measured close to the ground level to 36-40 μm 2 /cm 3 measured close to the rooftop level of the street canyon, and further to 16-26 μm 2 /cm 3 measured at 50 m. The high-resolution measurement data enabled an accurate analysis of the functional form of vertical profiles both in the street canyon and above the rooftop level. In both of these regions, exponential fits were used and the parameters obtained from the fits were thoroughly compared to the values found in literature. The results of this study indicated that the role of turbulent mixing caused by traffic was emphasized compared to the street canyon vortex as a driving force of the dispersion. In addition, the vertical profiles above the rooftop level showed a similar exponential decay compared to the profiles measured inside the street canyon. Copyright © 2018 Elsevier Ltd. All rights reserved.

  20. Utilization of the research and measurement reactor Braunschweig for neutron metrology

    Alberts, W.G.

    1982-01-01

    The objectives of the Physikalisch-Technische Bundesanstalt (PTB) with regard to neutron metrology are briefly described. The use of the PTB's Research and Measuring Reactor as neutron source for metrological purposes is discussed. Reference neutron beams are described which serve as irradiation facilities for the calibration of detectors for radiation protection purposes in the frame of the legal metrology work in the PTB. (orig.) [de

  1. European research project 'Metrology for radioactive waste management'

    Suran, J.

    2014-01-01

    The three-year European research project M etrology for Radioactive Waste Management' was launched in October 2011 under the EMRP (European Metrology Research Programme). It involves 13 European national metrology institutes and a total budget exceeds four million Euros. The project is coordinated by the Czech Metrology Institute and is divided into five working groups. This poster presents impact, excellence, relevance to EMPR objectives, and implementation and management of this project.(author)

  2. Three-dimensional measurement of small inner surface profiles using feature-based 3-D panoramic registration

    Gong, Yuanzheng; Seibel, Eric J.

    2017-01-01

    Rapid development in the performance of sophisticated optical components, digital image sensors, and computer abilities along with decreasing costs has enabled three-dimensional (3-D) optical measurement to replace more traditional methods in manufacturing and quality control. The advantages of 3-D optical measurement, such as noncontact, high accuracy, rapid operation, and the ability for automation, are extremely valuable for inline manufacturing. However, most of the current optical approaches are eligible for exterior instead of internal surfaces of machined parts. A 3-D optical measurement approach is proposed based on machine vision for the 3-D profile measurement of tiny complex internal surfaces, such as internally threaded holes. To capture the full topographic extent (peak to valley) of threads, a side-view commercial rigid scope is used to collect images at known camera positions and orientations. A 3-D point cloud is generated with multiview stereo vision using linear motion of the test piece, which is repeated by a rotation to form additional point clouds. Registration of these point clouds into a complete reconstruction uses a proposed automated feature-based 3-D registration algorithm. The resulting 3-D reconstruction is compared with x-ray computed tomography to validate the feasibility of our proposed method for future robotically driven industrial 3-D inspection.

  3. Protein profiling of single epidermal cell types from Arabidopsis thaliana using surface-enhanced laser desorption and ionization technology.

    Ebert, Berit; Melle, Christian; Lieckfeldt, Elke; Zöller, Daniela; von Eggeling, Ferdinand; Fisahn, Joachim

    2008-08-25

    Here, we describe a novel approach for investigating differential protein expression within three epidermal cell types. In particular, 3000 single pavement, basal, and trichome cells from leaves of Arabidopsis thaliana were harvested by glass micro-capillaries. Subsequently, these single cell samples were joined to form pools of 100 individual cells and analyzed using the ProteinChip technology; SELDI: surface-enhanced laser desorption and ionization. As a result, numerous protein signals that were differentially expressed in the three epidermal cell types could be detected. One of these proteins was characterized by tryptical digestion and subsequent identification via tandem quadrupole-time of flight (Q-TOF) mass spectrometry. Down regulation of this sequenced small subunit precursor of ribulose-1,5 bisphosphate carboxylase(C) oxygenase(O) (RuBisCo) in trichome and basal cells indicates the sink status of these cell types that are located on the surface of A. thaliana source leaves. Based on the obtained protein profiles, we suggest a close functional relationship between basal and trichome cells at the protein level.

  4. Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy

    Wang Chuangye; Morgner, Harald

    2011-01-01

    In the current work, we first reconstructed the molar fraction-depth profiles of cation and anion near the surface of tetrabutylammonium iodide dissolved in formamide by a refined calculation procedure, based on angle resolved X-ray photoelectron spectroscopy experiments. In this calculation procedure, both the transmission functions of the core levels and the inelastic mean free paths of the photoelectrons have been taken into account. We have evaluated the partial molar volumes of surfactant and solvent by the densities of such solutions with different bulk concentrations. With those partial molar volumes, the molar concentration-depth profiles of tetrabutylammonium ion and iodide ion were determined. The surface excesses of both surfactant ions were then achieved directly by integrating these depth profiles. The anionic molar concentration-depth profiles and surface excesses have been compared with their counterparts determined by neutral impact ion scattering spectroscopy. The comparisons exhibit good agreements. Being capable of determining molar concentration-depth profiles of surfactant ions by core levels with different kinetic energies may extend the applicable range of ARXPS in investigating solution surfaces.

  5. Comparison of two metrological approaches for the prediction of human haptic perception

    Neumann, Annika; Frank, Daniel; Vondenhoff, Thomas; Schmitt, Robert

    2016-06-01

    Haptic perception is regarded as a key component of customer appreciation and acceptance for various products. The prediction of customers’ haptic perception is of interest both during product development and production phases. This paper presents the results of a multivariate analysis between perceived roughness and texture related surface measurements, to examine whether perceived roughness can be accurately predicted using technical measurements. Studies have shown that standardized measurement parameters, such as the roughness coefficients (e.g. Rz or Ra), do not show a one-dimensional linear correlation with the human perception (of roughness). Thus, an alternative measurement method was compared to standard measurements of roughness, in regard to its capability of predicting perceived roughness through technical measurements. To estimate perceived roughness, an experimental study was conducted in which 102 subjects evaluated four sets of 12 different geometrical surface structures regarding their relative perceived roughness. The two different metrological procedures were examined in relation to their capability to predict the perceived roughness of the subjects stated within the study. The standardized measurements of the surface roughness were made using a structured light 3D-scanner. As an alternative method, surface induced vibrations were measured by a finger-like sensor during robot-controlled traverse over a surface. The presented findings provide a better understanding of the predictability of human haptic perception using technical measurements.

  6. Spectroscopic metrology for isotope composition measurements and transfer standards

    Anyangwe Nwaboh, Javis; Balslev-Harder, David; Kääriäinen, Teemu; Richmond, Craig; Manninen, Albert; Mohn, Joachim; Kiseleva, Maria; Petersen, Jan C.; Werhahn, Olav; Ebert, Volker

    2017-04-01

    The World Meteorological Organization (WMO) has identified greenhouse gases such as CO2, CH4 and N2O as critical for global climate monitoring. Other molecules such as CO that has an indirect effect of enhancing global warming are also monitored. WMO has stated compatibility goals for atmospheric concentration and isotope ratio measurements of these gases, e.g. 0.1 ppm for CO2 concentration measurements in the northern hemisphere and 0.01 ‰ for δ13C-CO2. For measurements of the concentration of greenhouse gases, gas analysers are typically calibrated with static gas standards e.g. traceable to the WMO scale or to the International System of Units (SI) through a national metrology institute. However, concentrations of target components, e.g. CO, in static gas standards have been observed to drift, and typically the gas matrix as well as the isotopic composition of the target component does not always reflect field gas composition, leading to deviations of the analyser response, even after calibration. The deviations are dependent on the measurement technique. To address this issue, part of the HIGHGAS (Metrology for high-impact greenhouse gases) project [1] focused on the development of optical transfer standards (OTSs) for greenhouse gases, e.g. CO2 and CO, potentially complementing gas standards. Isotope ratio mass spectrometry (IRMS) [2] is currently used to provide state-of-the-art high precision (in the 0.01 ‰ range) measurements for the isotopic composition of greenhouse gases. However, there is a need for field-deployable techniques such as optical isotope ratio spectroscopy (OIRS) that can be combined with metrological measurement methods. Within the HIGHGAS project, OIRS methods and procedures based on e.g. cavity enhanced spectroscopy (CES) and tunable diode laser absorption spectroscopy (TDLAS), matched to metrological principles have been established for the measurement of 13C/12C and 18O/16O ratios in CO2, 15N/14N ratios in N2O, and 13C/12C and 2H

  7. Figuring and Polishing Precision Optical Surfaces, Phase I

    National Aeronautics and Space Administration — The requirements for cost effective manufacturing and metrology of large optical surfaces is instrumental for the success of future NASA programs such as LISA,...

  8. Characterization of an extrapolation chamber and radiochromic films for verifying the metrological coherence among beta radiation fields

    Castillo, Jhonny Antonio Benavente

    2011-01-01

    The metrological coherence among standard systems is a requirement for assuring the reliability of dosimetric quantities measurements in ionizing radiation field. Scientific and technologic improvements happened in beta radiation metrology with the installment of the new beta secondary standard BSS2 in Brazil and with the adoption of the internationally recommended beta reference radiations. The Dosimeter Calibration Laboratory of the Development Center for Nuclear Technology (LCD/CDTN), in Belo Horizonte, implemented the BSS2 and methodologies are investigated for characterizing the beta radiation fields by determining the field homogeneity, the accuracy and uncertainties in the absorbed dose in air measurements. In this work, a methodology to be used for verifying the metrological coherence among beta radiation fields in standard systems was investigated; an extrapolation chamber and radiochromic films were used and measurements were done in terms of absorbed dose in air. The reliability of both the extrapolation chamber and the radiochromic film was confirmed and their calibrations were done in the LCD/CDTN in 90 Sr/ 90 Y, 85 Kr and 147 Pm beta radiation fields. The angular coefficients of the extrapolation curves were determined with the chamber; the field mapping and homogeneity were obtained from dose profiles and isodose with the radiochromic films. A preliminary comparison between the LCD/CDTN and the Instrument Calibration Laboratory of the Nuclear and Energy Research Institute / Sao Paulo (LCI/IPEN) was carried out. Results with the extrapolation chamber measurements showed in terms of absorbed dose in air rates showed differences between both laboratories up to de -I % e 3%, for 90 Sr/ 90 Y, 85 Kr and 147 Pm beta radiation fields, respectively. Results with the EBT radiochromic films for 0.1, 0.3 and 0.15 Gy absorbed dose in air, for the same beta radiation fields, showed differences up to 3%, -9% and -53%. The beta radiation field mappings with

  9. Metrology of human-based and other qualitative measurements

    Pendrill, Leslie; Petersson, Niclas

    2016-09-01

    The metrology of human-based and other qualitative measurements is in its infancy—concepts such as traceability and uncertainty are as yet poorly developed. This paper reviews how a measurement system analysis approach, particularly invoking as performance metric the ability of a probe (such as a human being) acting as a measurement instrument to make a successful decision, can enable a more general metrological treatment of qualitative observations. Measures based on human observations are typically qualitative, not only in sectors, such as health care, services and safety, where the human factor is obvious, but also in customer perception of traditional products of all kinds. A principal challenge is that the usual tools of statistics normally employed for expressing measurement accuracy and uncertainty will probably not work reliably if relations between distances on different portions of scales are not fully known, as is typical of ordinal or other qualitative measurements. A key enabling insight is to connect the treatment of decision risks associated with measurement uncertainty to generalized linear modelling (GLM). Handling qualitative observations in this way unites information theory, the perceptive identification and choice paradigms of psychophysics. The Rasch invariant measure psychometric GLM approach in particular enables a proper treatment of ordinal data; a clear separation of probe and item attribute estimates; simple expressions for instrument sensitivity; etc. Examples include two aspects of the care of breast cancer patients, from diagnosis to rehabilitation. The Rasch approach leads in turn to opportunities of establishing metrological references for quality assurance of qualitative measurements. In psychometrics, one could imagine a certified reference for knowledge challenge, for example, a particular concept in understanding physics or for product quality of a certain health care service. Multivariate methods, such as Principal Component

  10. Metrology of human-based and other qualitative measurements

    Pendrill, Leslie; Petersson, Niclas

    2016-01-01

    The metrology of human-based and other qualitative measurements is in its infancy—concepts such as traceability and uncertainty are as yet poorly developed. This paper reviews how a measurement system analysis approach, particularly invoking as performance metric the ability of a probe (such as a human being) acting as a measurement instrument to make a successful decision, can enable a more general metrological treatment of qualitative observations. Measures based on human observations are typically qualitative, not only in sectors, such as health care, services and safety, where the human factor is obvious, but also in customer perception of traditional products of all kinds. A principal challenge is that the usual tools of statistics normally employed for expressing measurement accuracy and uncertainty will probably not work reliably if relations between distances on different portions of scales are not fully known, as is typical of ordinal or other qualitative measurements. A key enabling insight is to connect the treatment of decision risks associated with measurement uncertainty to generalized linear modelling (GLM). Handling qualitative observations in this way unites information theory, the perceptive identification and choice paradigms of psychophysics. The Rasch invariant measure psychometric GLM approach in particular enables a proper treatment of ordinal data; a clear separation of probe and item attribute estimates; simple expressions for instrument sensitivity; etc. Examples include two aspects of the care of breast cancer patients, from diagnosis to rehabilitation. The Rasch approach leads in turn to opportunities of establishing metrological references for quality assurance of qualitative measurements. In psychometrics, one could imagine a certified reference for knowledge challenge, for example, a particular concept in understanding physics or for product quality of a certain health care service. Multivariate methods, such as Principal Component

  11. Target-Tracking Camera for a Metrology System

    Liebe, Carl; Bartman, Randall; Chapsky, Jacob; Abramovici, Alexander; Brown, David

    2009-01-01

    An analog electronic camera that is part of a metrology system measures the varying direction to a light-emitting diode that serves as a bright point target. In the original application for which the camera was developed, the metrological system is used to determine the varying relative positions of radiating elements of an airborne synthetic aperture-radar (SAR) antenna as the airplane flexes during flight; precise knowledge of the relative positions as a function of time is needed for processing SAR readings. It has been common metrology system practice to measure the varying direction to a bright target by use of an electronic camera of the charge-coupled-device or active-pixel-sensor type. A major disadvantage of this practice arises from the necessity of reading out and digitizing the outputs from a large number of pixels and processing the resulting digital values in a computer to determine the centroid of a target: Because of the time taken by the readout, digitization, and computation, the update rate is limited to tens of hertz. In contrast, the analog nature of the present camera makes it possible to achieve an update rate of hundreds of hertz, and no computer is needed to determine the centroid. The camera is based on a position-sensitive detector (PSD), which is a rectangular photodiode with output contacts at opposite ends. PSDs are usually used in triangulation for measuring small distances. PSDs are manufactured in both one- and two-dimensional versions. Because it is very difficult to calibrate two-dimensional PSDs accurately, the focal-plane sensors used in this camera are two orthogonally mounted one-dimensional PSDs.

  12. Scientific language and metrology; El lenguaje cientificio y la metrologia

    Campo Maldonado, D. del; Martin Blasco, B.; Prieto Esteban, E.

    2011-07-01

    The International System of Units (SI) reflects all the decisions and recommendations regarding units of measurement issued by the General Conference on Weights and Measures, including rules for writing the names and symbols of measurement units and for expressing the values of quantities. Even though the SI is internationally accepted and is the declared legal system whose use is obligatory in Spain, the Spanish Metrology Centre has been detecting an incorrect use of the units of measurement both in textbooks at all levels and in scientific articles. (Author) 5 refs.

  13. Metrology-based control and profitability in the semiconductor industry

    Weber, Charles

    2001-06-01

    This paper summarizes three studies of the semiconductor industry conducted at SEMATECH and MIT's Sloan School of Management. In conjunction they lead to the conclusion that rapid problem solving is an essential component of profitability in the semiconductor industry, and that metrology-based control is instrumental to rapid problem solving. The studies also identify the need for defect attribution. Once a source of a defect has been identified, the appropriate resources--human and technological--need to be brought into the physically optimal location for corrective action. The Internet is likely to enable effective defect attribution by inducing collaboration between different companies.

  14. Ultrabroadband optical chirp linearization for precision metrology applications.

    Roos, Peter A; Reibel, Randy R; Berg, Trenton; Kaylor, Brant; Barber, Zeb W; Babbitt, Wm Randall

    2009-12-01

    We demonstrate precise linearization of ultrabroadband laser frequency chirps via a fiber-based self-heterodyne technique to enable extremely high-resolution, frequency-modulated cw laser-radar (LADAR) and a wide range of other metrology applications. Our frequency chirps cover bandwidths up to nearly 5 THz with frequency errors as low as 170 kHz, relative to linearity. We show that this performance enables 31-mum transform-limited LADAR range resolution (FWHM) and 86 nm range precisions over a 1.5 m range baseline. Much longer range baselines are possible but are limited by atmospheric turbulence and fiber dispersion.

  15. A focal plane metrology system and PSF centroiding experiment

    Li, Haitao; Li, Baoquan; Cao, Yang; Li, Ligang

    2016-10-01

    In this paper, we present an overview of a detector array equipment metrology testbed and a micro-pixel centroiding experiment currently under development at the National Space Science Center, Chinese Academy of Sciences. We discuss on-going development efforts aimed at calibrating the intra-/inter-pixel quantum efficiency and pixel positions for scientific grade CMOS detector, and review significant progress in achieving higher precision differential centroiding for pseudo star images in large area back-illuminated CMOS detector. Without calibration of pixel positions and intrapixel response, we have demonstrated that the standard deviation of differential centroiding is below 2.0e-3 pixels.

  16. Fringe pattern analysis for optical metrology theory, algorithms, and applications

    Servin, Manuel; Padilla, Moises

    2014-01-01

    The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such

  17. Laser metrology in fluid mechanics granulometry, temperature and concentration measurements

    Boutier, Alain

    2013-01-01

    In fluid mechanics, non-intrusive measurements are fundamental in order to improve knowledge of the behavior and main physical phenomena of flows in order to further validate codes.The principles and characteristics of the different techniques available in laser metrology are described in detail in this book.Velocity, temperature and concentration measurements by spectroscopic techniques based on light scattered by molecules are achieved by different techniques: laser-induced fluorescence, coherent anti-Stokes Raman scattering using lasers and parametric sources, and absorption sp

  18. Metrology measurements for large-aperture VPH gratings

    Zheng, Jessica R.; Gers, Luke; Heijmans, Jeroen

    2013-09-01

    The High Efficiency and Resolution Multi Element Spectrograph (HERMES) for the Australian Astronomical Observatory (AAO) uses four large aperture, high angle of incidence volume phase holographic gratings (VPHG) for high resolution `Galactic archaeology' spectroscopy. The large clear aperture, the high diffraction efficiency, the line frequency homogeneity, and mosaic alignment made manufacturing and testing challenging. We developed new metrology systems at the AAO to verify the performance of these VPH gratings. The measured diffraction efficiencies and line frequency of the VPH gratings received so far meet the vendor's provided data. The wavefront quality for the Blue VPH grating is good but the Green and Red VPH gratings need to be post polishing.

  19. Advanced Metrology for Characterization of Magnetic Tunnel Junctions

    Kjær, Daniel

    -plane tunneling (CIPT) for characterization of magnetic tunnel junctions (MTJs), which constitutes the key component not only in MRAM but also the read-heads of modern hard disk drives. MTJs are described by their tunnel magnetoresistance (TMR), which is the relative difference of the resistance area products (RA...... of this project has been to provide cheaper, faster and more precise metrology for MTJs. This goal has been achieved in part by the demonstration of a static field CIPT method, which allows us to reduce the measurement time by a factor of 5, by measuring only RA thus excluding TMR. This enhancement is obtained...

  20. LISA Pathfinder: Optical Metrology System monitoring during operations

    Audley, Heather E.; LISA Pathfinder Collaboration

    2017-05-01

    The LISA Pathfinder (LPF) mission has demonstrated excellent performance. In addition to having surpassed the main mission goals, data has been collected from the various subsystems throughout the duration of the mission. This data is a valuable resource, both for a more complete understanding of the LPF satellite and the differential acceleration measurements, as well as for the design of the future Laser Interferometer Space Antenna (LISA) mission. Initial analysis of the Optical Metrology System (OMS) data was performed as part of daily system monitoring, and more in-depth analyses are ongoing. This contribution presents an overview of these activities along with an introduction to the OMS.

  1. Accreditation experience of radioisotope metrology laboratory of Argentina

    Iglicki, A. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)]. E-mail: iglicki@cae.cnea.gov.ar; Mila, M.I. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)]. E-mail: mila@cae.cnea.gov.ar; Furnari, J.C. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Arenillas, P. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Cerutti, G. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Carballido, M. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Guillen, V. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Araya, X. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina); Bianchini, R. [Laboratorio de Metrologia de Radioisotopos, Comision Nacional de Energia Atomica (Argentina)

    2006-10-15

    This work presents the experience developed by the Radioisotope Metrology Laboratory (LMR), of the Argentine National Atomic Energy Commission (CNEA), as result of the accreditation process of the Quality System by ISO 17025 Standard. Considering the LMR as a calibration laboratory, services of secondary activity determinations and calibration of activimeters used in Nuclear Medicine were accredited. A peer review of the ({alpha}/{beta})-{gamma} coincidence system was also carried out. This work shows in detail the structure of the quality system, the results of the accrediting audit and gives the number of non-conformities detected and of observations made which have all been resolved.

  2. Accreditation experience of radioisotope metrology laboratory of Argentina

    Iglicki, A.; Mila, M.I.; Furnari, J.C.; Arenillas, P.; Cerutti, G.; Carballido, M.; Guillen, V.; Araya, X.; Bianchini, R.

    2006-01-01

    This work presents the experience developed by the Radioisotope Metrology Laboratory (LMR), of the Argentine National Atomic Energy Commission (CNEA), as result of the accreditation process of the Quality System by ISO 17025 Standard. Considering the LMR as a calibration laboratory, services of secondary activity determinations and calibration of activimeters used in Nuclear Medicine were accredited. A peer review of the (α/β)-γ coincidence system was also carried out. This work shows in detail the structure of the quality system, the results of the accrediting audit and gives the number of non-conformities detected and of observations made which have all been resolved

  3. Industrial, agricultural, and medical applications of radiation metrology

    Hubbell, J.H.

    1987-01-01

    Photon and particle radiations (gamma rays, X-rays, bremsstrahlung, electrons and other charged particles, neutrons) from radioactive isotopes, X-ray tubes, and accelerators are now widely used in gauging, production control, and other monitoring and metrology devices where avoidance of mechanical contact is desirable. The general principles of radiation gauges, which rely on detection of radiation transmitted by the sample, or on detection of scattered or other secondary radiations produced in the sample, are discussed. Examples of such devices currently used in industrial, agricultural, and medical situations are presented, and some anticipated developments are mentioned. (author)

  4. Development of a free software for laboratory of metrology

    Silveira, Renata R. da; Benevides, Clayton A.

    2014-01-01

    The Centro Regional de Ciencias Nucleares do Nordeste (CRCN-NE) has a Metrology Laboratory to realize radioactive assays and calibrations in X and gamma radiation. This job, realized before in a manual way, had only paper recording and a hard-working data recovery. The objective of this job was to develop an application with free software to manage the laboratory activities, as service recording, rastreability control and environmental conditions monitoring, beyond automate the certificates and reports. As result, we have obtained the optimization of the routine and the management of the laboratory. (author)

  5. The Quality Control of Reference Standards in Metrology Dosimetry

    Lazarevic, Dj.; Ciraj Bjelac, O.; Kovacevic, M.; Vukcevic, M.

    2008-01-01

    This works presents the quality control tests applied to two types of ionization chambers with suitable electrometers. Measuring assemblies were tested in order to assess their performance and adequacy for use as reference standards in ionising radiation metrology laboratory for calibrations in the field of radiotherapy and radiation protection. Two types of ionizing chambers (Farmer type, 0.6 cm 3 and spherical ionizing chamber, 1 l) with suitable electrometers were tested. Following test were performed: repeatability, long term stability, polarity and leakage current measurement. All tested measuring assemblies demonstrated proper performance, correctness and high reliance of measurements, since all implemented quality control test results were within acceptable limits. (author)

  6. A universal quantum module for quantum communication, computation, and metrology

    Hanks, Michael; Lo Piparo, Nicolò; Trupke, Michael; Schmiedmayer, Jorg; Munro, William J.; Nemoto, Kae

    2017-08-01

    In this work, we describe a simple module that could be ubiquitous for quantum information based applications. The basic modules comprises a single NV- center in diamond embedded in an optical cavity, where the cavity mediates interactions between photons and the electron spin (enabling entanglement distribution and efficient readout), while the nuclear spins constitutes a long-lived quantum memories capable of storing and processing quantum information. We discuss how a network of connected modules can be used for distributed metrology, communication and computation applications. Finally, we investigate the possible use of alternative diamond centers (SiV/GeV) within the module and illustrate potential advantages.

  7. Gemini NIFS survey of feeding and feedback processes in nearby active galaxies - II. The sample and surface mass density profiles

    Riffel, R. A.; Storchi-Bergmann, T.; Riffel, R.; Davies, R.; Bianchin, M.; Diniz, M. R.; Schönell, A. J.; Burtscher, L.; Crenshaw, M.; Fischer, T. C.; Dahmer-Hahn, L. G.; Dametto, N. Z.; Rosario, D.

    2018-02-01

    We present and characterize a sample of 20 nearby Seyfert galaxies selected for having BAT 14-195 keV luminosities LX ≥ 1041.5 erg s-1, redshift z ≤ 0.015, being accessible for observations with the Gemini Near-Infrared Field Spectrograph (NIFS) and showing extended [O III]λ5007 emission. Our goal is to study Active Galactic Nucleus (AGN) feeding and feedback processes from near-infrared integral-field spectra, which include both ionized (H II) and hot molecular (H2) emission. This sample is complemented by other nine Seyfert galaxies previously observed with NIFS. We show that the host galaxy properties (absolute magnitudes MB, MH, central stellar velocity dispersion and axial ratio) show a similar distribution to those of the 69 BAT AGN. For the 20 galaxies already observed, we present surface mass density (Σ) profiles for H II and H2 in their inner ˜500 pc, showing that H II emission presents a steeper radial gradient than H2. This can be attributed to the different excitation mechanisms: ionization by AGN radiation for H II and heating by X-rays for H2. The mean surface mass densities are in the range (0.2 ≤ ΣH II ≤ 35.9) M⊙ pc-2, and (0.2 ≤ ΣH2 ≤ 13.9)× 10-3 M⊙ pc-2, while the ratios between the H II and H2 masses range between ˜200 and 8000. The sample presented here will be used in future papers to map AGN gas excitation and kinematics, providing a census of the mass inflow and outflow rates and power as well as their relation with the AGN luminosity.

  8. Micropatch-arrayed pads for non-invasive spatial and temporal profiling of topical drugs on skin surface.

    Dutkiewicz, Ewelina P; Chiu, Hsien-Yi; Urban, Pawel L

    2015-11-01

    Micropatch-arrayed pads (MAPAs) are presented as a facile and sensitive sampling method for spatial profiling of topical agents adsorbed on the surface of skin. MAPAs are 28 × 28 mm sized pieces of polytetrafluoroethylene containing plurality of cavities filled with agarose hydrogel. They are affixed onto skin for 10 min with the purpose to collect drugs applied topically. Polar compounds are absorbed by the hydrogel micropatches. The probes are subsequently scanned by an automated nanospray desorption electrospray ionization mass spectrometry system operated in the tapping dual-polarity mode. When the liquid junction gets into contact with every micropatch, polar compounds absorbed in the hydrogel matrix are desorbed and transferred to the ion source. A 3D-printed interface prevents evaporation of hydrogel micropatches assuring good reproducibility and sensitivity. MAPAs have been applied to follow dispersion of topical drugs applied to human skin in vivo and to porcine skin ex vivo, in the form of self-adhesive patches. Spatiotemporal characteristics of the drug dispersion process have been revealed using this non-invasive test. Differences between drug dispersion in vivo and ex vivo could be observed. We envision that MAPAs can be used to investigate spatiotemporal kinetics of various topical agents utilized in medical treatment. Copyright © 2015 John Wiley & Sons, Ltd.

  9. Long-Term Impact of Sediment Deposition and Erosion on Water Surface Profiles in the Ner River

    Tomasz Dysarz

    2017-02-01

    Full Text Available The purpose of the paper is to test forecasting of the sediment transport process, taking into account two main uncertainties involved in sediment transport modeling. These are: the lack of knowledge regarding future flows, and the uncertainty with respect to which sediment transport formula should be chosen for simulations. The river reach chosen for study is the outlet part of the Ner River, located in the central part of Poland. The main characteristic of the river is the presence of an intensive morphodynamic process, increasing flooding frequency. The approach proposed here is based on simulations with a sediment-routing model and assessment of the hydraulic condition changes on the basis of hydrodynamic calculations for the chosen characteristic flows. The data used include Digital Terrain Models (DTMs, cross-section measurements, and hydrological observations from the Dabie gauge station. The sediment and hydrodynamic calculations are performed using program HEC-RAS 5.0. Twenty inflow scenarios are of a 10-year duration and are composed on the basis of historical data. Meyer-Peter and Müller and Engelund-Hansen formulae are applied for the calculation of sediment transport intensity. The methodology presented here seems to be a good tool for the prediction of long-term impacts on water surface profiles caused by sediment deposition and erosion.

  10. Quasi-periodic oscillations of aerosol backscatter profiles and surface meteorological parameters during winter nights over a tropical station

    M. G. Manoj

    2011-03-01

    Full Text Available Atmospheric gravity waves, which are a manifestation of the fluctuations in buoyancy of the air parcels, are well known for their direct influence on concentration of atmospheric trace gases and aerosols, and also on oscillations of meteorological variables such as temperature, wind speed, visibility and so on. The present paper reports quasi-periodic oscillations in the lidar backscatter signal strength due to aerosol fluctuations in the nocturnal boundary layer, studied with a high space-time resolution polarimetric micro pulse lidar and concurrent meteorological parameters over a tropical station in India. The results of the spectral analysis of the data, archived on some typical clear-sky conditions during winter months of 2008 and 2009, exhibit a prominent periodicity of 20–40 min in lidar-observed aerosol variability and show close association with those observed in the near-surface temperature and wind at 5% statistical significance. Moreover, the lidar aerosol backscatter signal strength variations at different altitudes, which have been generated from the height-time series of the one-minute interval profiles at 2.4 m vertical resolution, indicate vertical propagation of these waves, exchanging energy between lower and higher height levels. Such oscillations are favoured by the stable atmospheric background condition and peculiar topography of the experimental site. Accurate representation of these buoyancy waves is essential in predicting the sporadic fluctuations of weather in the tropics.

  11. Frequency Characteristics of Surface Wave Generated by Single-Line Pulsed Laser Beam with Two Kinds of Spatial Energy Profile Models: Gaussian and Square-Like

    Seo, Ho Geon; Kim, Myung Hwan; Choi, Sung Ho; Kim, Chung Seok; Jhang, Kyung Young [Hanyang University, Seoul (Korea, Republic of)

    2012-08-15

    Using a single-line pulsed laser beam is well known as a useful noncontact method to generate a directional surface acoustic wave. In this method, different laser beam energy profiles produce different waveforms and frequency characteristics. In this paper, we considered two typical kinds of laser beam energy profiles, Gaussian and square-like, to find out a difference in the frequency characteristics. To achieve this, mathematical models were proposed first for Gaussian laser beam profile and square-like respectively, both of which depended on the laser beam width. To verify the theoretical models, experimental setups with a cylindrical lens and a line-slit mask were respectively designed to produce a line laser beam with Gaussian spatial energy profile and square-like. The frequency responses of the theoretical models showed good agreement with experimental results in terms of the existence of harmonic frequency components and the shift of the first peak frequencies to low.

  12. National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN; Laboratorio Nacional de Metrologia das Radiacoes Ionizantes

    NONE

    1993-12-31

    The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs.

  13. Management of metrology in measuring of the displacement of building construction

    Jiří Kratochvíl

    2007-06-01

    Full Text Available The metrology management of the measurement of the displacement of building construction is not regulated in the standard ČSN ISO 73 0405 - Measurement of the displacement of building construction. But the metrology management has to be included in the project of measurement of the displacement (Stage of project. Then we have to pay an attention to the metrological management during this measurement (Stage of realization and during the evaluation of this measurement (Stage of evaluation. We have to insist on the subsequent improving of metrology management within the frame of the next project (so-called feedback. The metrology management in the measurement of the displacement during the stages should be based on an application of statutory instruments and technical standards. We should insist especially on the system of standards for the quality control ISO 9000. Considering specialities of geodetic measurements it is necessary to adapt the metrology management. That is why it will differ from the metrology management in other fields of knowledge. This paper includes some steps of metrological provision which must not be ignored.

  14. Quantum interference metrology at deep-UV wavelengths using phase-controlled ultrashort laser pulses

    Zinkstok, R. Th; Witte, S.; Ubachs, W.; Hogervorst, W.; Eikema, K. S E

    2005-01-01

    High-resolution metrology at wavelengths shorter than ultraviolet is in general hampered by a limited availability of appropriate laser sources. It is demonstrated that this limitation can be overcome by quantum-interference metrology with frequency up-converted ultrafast laser pulses. The required

  15. Issues of Teaching Metrology in Higher Education Institutions of Civil Engineering in Russia

    Pukharenko, Yurii Vladimirovich; Norin, Veniamin Aleksandrovich

    2017-01-01

    The work analyses the training process condition in teaching the discipline "Metrology, Standardization, Certification and Quality Control." It proves that the current educational standard regarding the instruction of the discipline "Metrology, Standardization, Certification and Quality Control" does not meet the needs of the…

  16. National Laboratory of Ionizing Radiation Metrology - Brazilian CNEN; Laboratorio Nacional de Metrologia das Radiacoes Ionizantes

    NONE

    1992-12-31

    The activities of the Brazilian National Laboratory of Ionizing Radiations Metrology are described. They include research and development of metrological techniques and procedures, the calibration of area radiation monitors, clinical dosemeters and other instruments and the preparation and standardization of reference radioactive sources. 4 figs., 13 tabs.

  17. Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films

    Yan, X.L.; Coetsee, E. [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Wang, J.Y., E-mail: wangjy@stu.edu.cn [Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063, Guangdong (China); Swart, H.C., E-mail: swartHC@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Terblans, J.J., E-mail: terblansjj@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa)

    2017-07-31

    Highlights: • Linear Least Square (LLS) method used to separate Ni and Cu Auger spectra. • The depth-dependent ion sputtering induced roughness was quantitatively evaluated. • The depth resolution better when profiling with dual-ion beam vs. a single-ion beam. • AES depth profiling with a lower ion energy results in a better depth resolution. - Abstract: The polycrystalline Ni/Cu multilayer thin films consisting of 8 alternating layers of Ni and Cu were deposited on a SiO{sub 2} substrate by means of electron beam evaporation in a high vacuum. Concentration-depth profiles of the as-deposited multilayered Ni/Cu thin films were determined with Auger electron spectroscopy (AES) in combination with Ar{sup +} ion sputtering, under various bombardment conditions with the samples been stationary as well as rotating in some cases. The Mixing-Roughness-Information depth (MRI) model used for the fittings of the concentration-depth profiles accounts for the interface broadening of the experimental depth profiling. The interface broadening incorporates the effects of atomic mixing, surface roughness and information depth of the Auger electrons. The roughness values extracted from the MRI model fitting of the depth profiling data agrees well with those measured by atomic force microscopy (AFM). The ion sputtering induced surface roughness during the depth profiling was accordingly quantitatively evaluated from the fitted MRI parameters with sample rotation and stationary conditions. The depth resolutions of the AES depth profiles were derived directly from the values determined by the fitting parameters in the MRI model.

  18. Industrial Photogrammetry - Accepted Metrology Tool or Exotic Niche

    Bösemann, Werner

    2016-06-01

    New production technologies like 3D printing and other adaptive manufacturing technologies have changed the industrial manufacturing process, often referred to as next industrial revolution or short industry 4.0. Such Cyber Physical Production Systems combine virtual and real world through digitization, model building process simulation and optimization. It is commonly understood that measurement technologies are the key to combine the real and virtual worlds (eg. [Schmitt 2014]). This change from measurement as a quality control tool to a fully integrated step in the production process has also changed the requirements for 3D metrology solutions. Key words like MAA (Measurement Assisted Assembly) illustrate that new position of metrology in the industrial production process. At the same time it is obvious that these processes not only require more measurements but also systems to deliver the required information in high density in a short time. Here optical solutions including photogrammetry for 3D measurements have big advantages over traditional mechanical CMM's. The paper describes the relevance of different photogrammetric solutions including state of the art, industry requirements and application examples.

  19. The origins of the metrology of ionizing radiation

    Paschoa, Anselmo S. [Pontificia Univ. Catolica do Rio de Janeiro, RJ (Brazil). Dept. de Fisica]. E-mail: aspas@itaipu.vdg.fis.puc-rio.br

    2000-07-01

    Metrology of ionizing radiation started soon after the discovery of radioactivity. However, the modern metrology of ionizing radiation can be considered a by product of the Manhattan Project. When this mammoth effort to produce the first nuclear weapons was initiated, little was known about some of the properties of natural elements, though the phenomenon of natural radioactivity was already known for almost half a century. Less was known about the radioactive materials involved in that project. The amount of those materials which had to be handled were higher than any amount of {sup 226} Ra and {sup 228} Ra ever used thus far. The first atomic piles produced concentration levels of radioactivity much higher than any level known before. There was then a threat not only for the health of hundred of technicians and scientists, but also for thousands of workers. The secrecy involving that project would not allow much to be told about the radioactive hazards. There was, however, the need to protect workers and the public in General against unnecessary exposures to ionizing radiation. The origin of the standards used in radiological protection from pre-world war II and their remarkable evolution during and immediately after this war will be discussed in the paper. (author)

  20. The origins of the metrology of ionizing radiation

    Paschoa, Anselmo S.

    2000-01-01

    Metrology of ionizing radiation started soon after the discovery of radioactivity. However, the modern metrology of ionizing radiation can be considered a by product of the Manhattan Project. When this mammoth effort to produce the first nuclear weapons was initiated, little was known about some of the properties of natural elements, though the phenomenon of natural radioactivity was already known for almost half a century. Less was known about the radioactive materials involved in that project. The amount of those materials which had to be handled were higher than any amount of 226 Ra and 228 Ra ever used thus far. The first atomic piles produced concentration levels of radioactivity much higher than any level known before. There was then a threat not only for the health of hundred of technicians and scientists, but also for thousands of workers. The secrecy involving that project would not allow much to be told about the radioactive hazards. There was, however, the need to protect workers and the public in General against unnecessary exposures to ionizing radiation. The origin of the standards used in radiological protection from pre-world war II and their remarkable evolution during and immediately after this war will be discussed in the paper. (author)