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Sample records for sio2 gate oxide

  1. Effect of size and position of gold nanocrystals embedded in gate oxide of SiO2/Si MOS structures

    Science.gov (United States)

    Chakraborty, Chaitali; Bose, Chayanika

    2016-02-01

    The influence of single and double layered gold (Au) nanocrystals (NC), embedded in SiO2 matrix, on the electrical characteristics of metal-oxide-semiconductor (MOS) structures is reported in this communication. The size and position of the NCs are varied and study is made using Sentaurus TCAD simulation tools. In a single NC-layered MOS structure, the role of NCs is more prominent when they are placed closer to SiO2/Si-substrate interface than to SiO2/Al-gate interface. In MOS structures with larger NC dots and double layered NCs, the charge storage capacity is increased due to charging of the dielectric in the presence of NCs. Higher breakdown voltage and smaller leakage current are also obtained in the case of dual NC-layered MOS device. A new phenomenon of smearing out of the capacitance-voltage curve is observed in the presence of dual NC layer indicating generation of interface traps. An internal electric field developed between these two charged NC layers is expected to generate such interface traps at the SiO2/Si interface.

  2. Memory and learning behaviors mimicked in nanogranular SiO2-based proton conductor gated oxide-based synaptic transistors.

    Science.gov (United States)

    Wan, Chang Jin; Zhu, Li Qiang; Zhou, Ju Mei; Shi, Yi; Wan, Qing

    2013-11-07

    In neuroscience, signal processing, memory and learning function are established in the brain by modifying ionic fluxes in neurons and synapses. Emulation of memory and learning behaviors of biological systems by nanoscale ionic/electronic devices is highly desirable for building neuromorphic systems or even artificial neural networks. Here, novel artificial synapses based on junctionless oxide-based protonic/electronic hybrid transistors gated by nanogranular phosphorus-doped SiO2-based proton-conducting films are fabricated on glass substrates by a room-temperature process. Short-term memory (STM) and long-term memory (LTM) are mimicked by tuning the pulse gate voltage amplitude. The LTM process in such an artificial synapse is due to the proton-related interfacial electrochemical reaction. Our results are highly desirable for building future neuromorphic systems or even artificial networks via electronic elements.

  3. Lateral protonic/electronic hybrid oxide thin-film transistor gated by SiO2 nanogranular films

    International Nuclear Information System (INIS)

    Zhu, Li Qiang; Chao, Jin Yu; Xiao, Hui

    2014-01-01

    Ionic/electronic interaction offers an additional dimension in the recent advancements of condensed materials. Here, lateral gate control of conductivities of indium-zinc-oxide (IZO) films is reported. An electric-double-layer (EDL) transistor configuration was utilized with a phosphorous-doped SiO 2 nanogranular film to provide a strong lateral electric field. Due to the strong lateral protonic/electronic interfacial coupling effect, the IZO EDL transistor could operate at a low-voltage of 1 V. A resistor-loaded inverter is built, showing a high voltage gain of ∼8 at a low supply voltage of 1 V. The lateral ionic/electronic coupling effects are interesting for bioelectronics and portable electronics

  4. Effect of size and position of gold nanocrystals embedded in gate oxide of SiO2/Si MOS structures

    Directory of Open Access Journals (Sweden)

    Chaitali Chakraborty

    2016-03-01

    Full Text Available The influence of single and double layered gold (Au nanocrystals (NC, embedded in SiO2 matrix, on the electrical characteristics of metal–oxide–semiconductor (MOS structures is reported in this communication. The size and position of the NCs are varied and study is made using Sentaurus TCAD simulation tools. In a single NC-layered MOS structure, the role of NCs is more prominent when they are placed closer to SiO2/Si−substrate interface than to SiO2/Al–gate interface. In MOS structures with larger NC dots and double layered NCs, the charge storage capacity is increased due to charging of the dielectric in the presence of NCs. Higher breakdown voltage and smaller leakage current are also obtained in the case of dual NC-layered MOS device. A new phenomenon of smearing out of the capacitance–voltage curve is observed in the presence of dual NC layer indicating generation of interface traps. An internal electric field developed between these two charged NC layers is expected to generate such interface traps at the SiO2/Si interface.

  5. Control of Ga-oxide interlayer growth and Ga diffusion in SiO2/GaN stacks for high-quality GaN-based metal–oxide–semiconductor devices with improved gate dielectric reliability

    Science.gov (United States)

    Yamada, Takahiro; Watanabe, Kenta; Nozaki, Mikito; Yamada, Hisashi; Takahashi, Tokio; Shimizu, Mitsuaki; Yoshigoe, Akitaka; Hosoi, Takuji; Shimura, Takayoshi; Watanabe, Heiji

    2018-01-01

    A simple and feasible method for fabricating high-quality and highly reliable GaN-based metal–oxide–semiconductor (MOS) devices was developed. The direct chemical vapor deposition of SiO2 films on GaN substrates forming Ga-oxide interlayers was carried out to fabricate SiO2/GaO x /GaN stacked structures. Although well-behaved hysteresis-free GaN-MOS capacitors with extremely low interface state densities below 1010 cm‑2 eV‑1 were obtained by postdeposition annealing, Ga diffusion into overlying SiO2 layers severely degraded the dielectric breakdown characteristics. However, this problem was found to be solved by rapid thermal processing, leading to the superior performance of the GaN-MOS devices in terms of interface quality, insulating property, and gate dielectric reliability.

  6. Improved linearity and reliability in GaN metal-oxide-semiconductor high-electron-mobility transistors using nanolaminate La2O3/SiO2 gate dielectric

    Science.gov (United States)

    Hsu, Ching-Hsiang; Shih, Wang-Cheng; Lin, Yueh-Chin; Hsu, Heng-Tung; Hsu, Hisang-Hua; Huang, Yu-Xiang; Lin, Tai-Wei; Wu, Chia-Hsun; Wu, Wen-Hao; Maa, Jer-Shen; Iwai, Hiroshi; Kakushima, Kuniyuki; Chang, Edward Yi

    2016-04-01

    Improved device performance to enable high-linearity power applications has been discussed in this study. We have compared the La2O3/SiO2 AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors (MOS-HEMTs) with other La2O3-based (La2O3/HfO2, La2O3/CeO2 and single La2O3) MOS-HEMTs. It was found that forming lanthanum silicate films can not only improve the dielectric quality but also can improve the device characteristics. The improved gate insulation, reliability, and linearity of the 8 nm La2O3/SiO2 MOS-HEMT were demonstrated.

  7. Current Tunnelling in MOS Devices with Al2O3/SiO2 Gate Dielectric

    Directory of Open Access Journals (Sweden)

    A. Bouazra

    2008-01-01

    Full Text Available With the continued scaling of the SiO2 thickness below 2 nm in CMOS devices, a large direct-tunnelling current flow between the gate electrode and silicon substrate is greatly impacting device performance. Therefore, higher dielectric constant materials are desirable for reducing the gate leakage while maintaining transistor performance for very thin dielectric layers. Despite its not very high dielectric constant (∼10, Al2O3 has emerged as one of the most promising high-k candidates in terms of its chemical and thermal stability as its high-barrier offset. In this paper, a theoretical study of the physical and electrical properties of Al2O3 gate dielectric is reported including I(V and C(V characteristics. By using a stack of Al2O3/SiO2 with an appropriate equivalent oxide thickness of gate dielectric MOS, the gate leakage exhibits an important decrease. The effect of carrier trap parameters (depth and width at the Al2O3/SiO2 interface is also discussed.

  8. Nanogranular SiO2 proton gated silicon layer transistor mimicking biological synapses

    International Nuclear Information System (INIS)

    Liu, M. J.; Huang, G. S.; Guo, Q. L.; Tian, Z. A.; Li, G. J.; Mei, Y. F.; Feng, P.; Shao, F.; Wan, Q.

    2016-01-01

    Silicon on insulator (SOI)-based transistors gated by nanogranular SiO 2 proton conducting electrolytes were fabricated to mimic synapse behaviors. This SOI-based device has both top proton gate and bottom buried oxide gate. Electrical transfer properties of top proton gate show hysteresis curves different from those of bottom gate, and therefore, excitatory post-synaptic current and paired pulse facilitation (PPF) behavior of biological synapses are mimicked. Moreover, we noticed that PPF index can be effectively tuned by the spike interval applied on the top proton gate. Synaptic behaviors and functions, like short-term memory, and its properties are also experimentally demonstrated in our device. Such SOI-based electronic synapses are promising for building neuromorphic systems.

  9. Nitric acid oxidation of Si (NAOS) method for low temperature fabrication of SiO2/Si and SiO2/SiC structures

    International Nuclear Information System (INIS)

    Kobayashi, H.; Imamura, K.; Kim, W.-B.; Im, S.-S.; Asuha

    2010-01-01

    We have developed low temperature formation methods of SiO 2 /Si and SiO 2 /SiC structures by use of nitric acid, i.e., nitric acid oxidation of Si (or SiC) (NAOS) methods. By use of the azeotropic NAOS method (i.e., immersion in 68 wt% HNO 3 aqueous solutions at 120 deg. C), an ultrathin (i.e., 1.3-1.4 nm) SiO 2 layer with a low leakage current density can be formed on Si. The leakage current density can be further decreased by post-metallization anneal (PMA) at 200 deg. C in hydrogen atmosphere, and consequently the leakage current density at the gate bias voltage of 1 V becomes 1/4-1/20 of that of an ultrathin (i.e., 1.5 nm) thermal oxide layer usually formed at temperatures between 800 and 900 deg. C. The low leakage current density is attributable to (i) low interface state density, (ii) low SiO 2 gap-state density, and (iii) high band discontinuity energy at the SiO 2 /Si interface arising from the high atomic density of the NAOS SiO 2 layer. For the formation of a relatively thick (i.e., ≥10 nm) SiO 2 layer, we have developed the two-step NAOS method in which the initial and subsequent oxidation is performed by immersion in ∼40 wt% HNO 3 and azeotropic HNO 3 aqueous solutions, respectively. In this case, the SiO 2 formation rate does not depend on the Si surface orientation. Using the two-step NAOS method, a uniform thickness SiO 2 layer can be formed even on the rough surface of poly-crystalline Si thin films. The atomic density of the two-step NAOS SiO 2 layer is slightly higher than that for thermal oxide. When PMA at 250 deg. C in hydrogen is performed on the two-step NAOS SiO 2 layer, the current-voltage and capacitance-voltage characteristics become as good as those for thermal oxide formed at 900 deg. C. A relatively thick (i.e., ≥10 nm) SiO 2 layer can also be formed on SiC at 120 deg. C by use of the two-step NAOS method. With no treatment before the NAOS method, the leakage current density is very high, but by heat treatment at 400 deg. C in

  10. A pentacene thin film transistor with good performance using sol-gel derived SiO2 gate dielectric layer

    Science.gov (United States)

    Cavas, M.; Al-Ghamdi, Ahmed A.; Al-Hartomy, O. A.; El-Tantawy, F.; Yakuphanoglu, F.

    2013-02-01

    A low-voltage pentacene field-effect transistor with sol-gel derived SiO2 gate dielectric was fabricated. The mobility of the transistor was achieved as high as 1.526 cm2/V on the bared SiO2/Si substrate by a higher dielectric constant. The interface state density for the transistor was found to vary from 3.8 × 1010 to 7.5 × 1010 eV-1 cm-2 at frequency range of 100 kHz-1 MHz. It is evaluated that the SiO2 derived by low cost sol-gel is quite a promising candidate as a gate dielectric layer for low-voltage pentacene field-effect transistor.

  11. Microporous SiO2 with huge electric-double-layer capacitance for low-voltage indium tin oxide thin-film transistors

    International Nuclear Information System (INIS)

    Lu Aixia; Sun Jia; Jiang Jie; Wan Qing

    2009-01-01

    Electric-double-layer (EDL) effect is observed in microporous SiO 2 dielectric films deposited at room temperature by plasma-enhanced chemical vapor deposition method. Indium tin oxide thin-film transistors gated by such microporous SiO 2 gate dielectric are fabricated at room temperature, and a low operating voltage of 1.5 V is obtained due to the huge EDL specific capacitance (2.14 μF/cm 2 ). The field-effect electron mobility is estimated to be 118 cm 2 V -1 s -1 . Current on/off ratio and subthreshold gate voltage swing are estimated to be 5x10 6 and 92 mV/decade, respectively. Room-temperature deposited microporous SiO 2 dielectric is promising for low-power field-effect transistors on temperature sensitive substrates.

  12. Interface States Densities Effect at SiO2/ Polysilicon and SiO2/ Monosilicon Surfaces on N-polysilicon /Oxide/ P-Monosilicon Capacitance

    Directory of Open Access Journals (Sweden)

    H. Dib

    2014-05-01

    Full Text Available the interface states have a very significant role in the components containing MOS structures. In this paper we study the interface states densities effect at SiO2/ N-polysilicon and SiO2/ P- monosilicon surfaces on metal/polysilicon /oxide/ monosilicon capacitance. The numerical solution of poisson's equation and the determination of the charge variation in the structure induced by application of external bias (Vg allow simulating the capacitance-voltage MSPOS characteristics. The results show that the interface states at SiO2/ polysilicon and SiO2/ monosilicon surfaces translate the CT (V curve about positive voltage and cause the increase of the minimum value of capacitance. The effect of interface states on C (V curves is neglected for the polysilicon doping concentration in order to 1019 cm-3. For this doping level, the C (V curves are identical to the C (V of the monocristalline MOS structure.

  13. Titanium-tungsten nanocrystals embedded in a SiO2/Al2O3 gate dielectric stack for low-voltage operation in non-volatile memory

    International Nuclear Information System (INIS)

    Yang Shiqian; Wang Qin; Zhang Manhong; Long Shibing; Liu Jing; Liu Ming

    2010-01-01

    Titanium-tungsten nanocrystals (NCs) were fabricated by a self-assembly rapid thermal annealing (RTA) process. Well isolated Ti 0.46 W 0.54 NCs were embedded in the gate dielectric stack of SiO 2 /Al 2 O 3 . A metal-oxide-semiconductor (MOS) capacitor was fabricated to investigate its application in a non-volatile memory (NVM) device. It demonstrated a large memory window of 6.2 V in terms of flat-band voltage (V FB ) shift under a dual-directional sweeping gate voltage of - 10 to 10 V. A 1.1 V V FB shift under a low dual-directional sweeping gate voltage of - 4 to 4 V was also observed. The retention characteristic of this MOS capacitor was demonstrated by a 0.5 V memory window after 10 4 s of elapsed time at room temperature. The endurance characteristic was demonstrated by a program/erase cycling test.

  14. Experimental and theoretical investigation of the effect of SiO2 content in gate dielectrics on work function shift induced by nanoscale capping layers

    KAUST Repository

    Caraveo-Frescas, J. A.

    2012-09-10

    The impact of SiO2 content in ultrathin gate dielectrics on the magnitude of the effective work function (EWF) shift induced by nanoscale capping layers has been investigated experimentally and theoretically. The magnitude of the effective work function shift for four different capping layers (AlN, Al2O3, La2O3, and Gd2O3) is measured as a function of SiO2 content in the gate dielectric. A nearly linear increase of this shift with SiO2 content is observed for all capping layers. The origin of this dependence is explained using density functional theory simulations.

  15. The Obtaining of Nano Oxide Systems SiO2-REE with Alkoxide Technology

    Science.gov (United States)

    Amelina, Anna; Grinberg, Evgenii

    A lot of oxides systems with REE as dopants are used in catalytic processes in organic synthesis. They are very perspectives as thermostable coating in aerospace technics. These systems are usually based on silicon or aluminium oxides and doped with rare-earth elements. This systems can be produced by different methods. One of the most perspective of them is “sol-gel”-method with silicium, aluminium and rare-earth alkoxides as a precursor of doped silica and alumina, or their derivatives. Thus the obtaining of composite SiO _{2} - REE oxide materials by the hydrolysis doped with rare-earth elements was suggested. Some of alcoholate derivatives such as El(OR)n were used in this processes. The SiO _{2}- REE oxides were precipitated during the sol-gel process, where tetraethoxysilane (TEOS) as used as SiO _{2} sources. Also it is known that alkoxides of alkali metals, including lithium alkoxides, are widely used in industry and synthetic chemistry, as well as a source of lithium in various mixed oxide compositions, such as lithium niobate, lithium tantalate or lithium silicate. Therefore, we attempted to obtain the lithium silicate, which is also doped with rare-earth elements. Lithium silicate was obtained by alkaline hydrolysis of tetraethoxysilane with lithium alkoxide. Lithium alkoxide were synthesized by dissolving at metal in the corresponding alcohol are examined. The dependence of the rate of dissolving of the metal on the method of mixing of the reaction mixture and the degree of metal dispersion was investigated. The mathematical model of the process was composed and also optimization of process was carried out. Some oxide SiO _{2}, Al _{2}O _{3} and rare-earth nanostructured systems were obtained by sol-gel-method. The size of particle was determined by electron and X-ray spectroscopy and was in the range of 5 - 15 nm. Purity of this oxide examples for contaminating of heavy metals consists n.(1E-4...1E-5) wt%. Sols obtained by this method may be used

  16. Titanium-tungsten nanocrystals embedded in a SiO(2)/Al(2)O(3) gate dielectric stack for low-voltage operation in non-volatile memory.

    Science.gov (United States)

    Yang, Shiqian; Wang, Qin; Zhang, Manhong; Long, Shibing; Liu, Jing; Liu, Ming

    2010-06-18

    Titanium-tungsten nanocrystals (NCs) were fabricated by a self-assembly rapid thermal annealing (RTA) process. Well isolated Ti(0.46)W(0.54) NCs were embedded in the gate dielectric stack of SiO(2)/Al(2)O(3). A metal-oxide-semiconductor (MOS) capacitor was fabricated to investigate its application in a non-volatile memory (NVM) device. It demonstrated a large memory window of 6.2 V in terms of flat-band voltage (V(FB)) shift under a dual-directional sweeping gate voltage of - 10 to 10 V. A 1.1 V V(FB) shift under a low dual-directional sweeping gate voltage of - 4 to 4 V was also observed. The retention characteristic of this MOS capacitor was demonstrated by a 0.5 V memory window after 10(4) s of elapsed time at room temperature. The endurance characteristic was demonstrated by a program/erase cycling test.

  17. Physics of Trap Generation and Electrical Breakdown in Ultra-thin SiO2 and SiON Gate Dielectric Materials

    NARCIS (Netherlands)

    Nicollian, Paul Edward

    2007-01-01

    This work spans nearly a decade of industrial research in the reliability physics of deeply scaled SiO2 and SiON gate dielectrics. In this work, we will present our following original contributions to the field: • Below 5V stress, the dominant mechanism for stressed induced leakage current in the

  18. FABRICATION AND PROPERTIES OF SiO2/ZIRCONIUM PHOSPHATE-B2O3-SiO2 ANTI-OXIDATION COATINGS FOR Cf/SiC COMPOSITES

    OpenAIRE

    Xue-Jin Yang; Yu-Di Zhang; Zhang Chang-Rui; Li Bin

    2015-01-01

    This paper reports the fabrication of a novel SiO2/zirconium phosphate (ZrP)-B2O3-SiO2 double-layer coating on Cf/SiC composites via brushing and sol-gel routes for achieving better anti-oxidation performance. The composition of raw materials and sintering temperature were studied to explore the possibility of development of ZrP coatings to meet the demand for oxidation resistance at high temperature. It was attempted to improve the self-healing ability of coatings via an additional SiO2 laye...

  19. Surface properties of SiO2 with and without H2O2 treatment as gate dielectrics for pentacene thin-film transistor applications

    Science.gov (United States)

    Hung, Cheng-Chun; Lin, Yow-Jon

    2018-01-01

    The effect of H2O2 treatment on the surface properties of SiO2 is studied. H2O2 treatment leads to the formation of Si(sbnd OH)x at the SiO2 surface that serves to reduce the number of trap states, inducing the shift of the Fermi level toward the conduction band minimum. H2O2 treatment also leads to a noticeable reduction in the value of the SiO2 capacitance per unit area. The effect of SiO2 layers with H2O2 treatment on the behavior of carrier transports for the pentacene/SiO2-based organic thin-film transistor (OTFT) is also studied. Experimental identification confirms that the shift of the threshold voltage towards negative gate-source voltages is due to the reduced number of trap states in SiO2 near the pentacene/SiO2 interface. The existence of a hydrogenated layer between pentacene and SiO2 leads to a change in the pentacene-SiO2 interaction, increasing the value of the carrier mobility.

  20. VO x /SiO 2 Catalyst Prepared by Grafting VOCl 3 on Silica for Oxidative Dehydrogenation of Propane

    KAUST Repository

    Zhu, Haibo

    2015-09-07

    The VOx/SiO2 catalysts for oxidative dehydrogenation of propane were synthesized by a simple grafting method. The VOCl3 was first grafted at the surface of SiO2, which was dehydrated at different temperature (from 200 to 1000°C). The formed grafted complexes were then calcined in air, leading to the formation of VOx/SiO2 catalysts. The synthesized catalysts were characterized by nitrogen adsorption, SEM, Raman spectroscopy, temperature-programmed reduction, and extended X-ray absorption fine structure analysis. The SiO2 pretreatment temperature has an evident effect on the loading and dispersion of VOx on SiO2, which finally affects their catalytic performance. High SiO2 treatment temperature is beneficial to dispersing the vanadium oxide species at the SiO2 surface. These materials are efficient catalysts for the catalytic oxidative dehydrogenation of propane to propylene. The best selectivity to propylene is achieved on the VOx/SiO2-(1000) catalyst. The high selectivity and activity are well maintained for three days catalytic reaction. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  1. Ultra-low power thin film transistors with gate oxide formed by nitric acid oxidation method

    International Nuclear Information System (INIS)

    Kobayashi, H.; Kim, W. B.; Matsumoto, T.

    2011-01-01

    We have developed a low temperature fabrication method of SiO 2 /Si structure by use of nitric acid, i.e., nitric acid oxidation of Si (NAOS) method, and applied it to thin film transistors (TFT). A silicon dioxide (SiO 2 ) layer formed by the NAOS method at room temperature possesses 1.8 nm thickness, and its leakage current density is as low as that of thermally grown SiO 2 layer with the same thickness formed at ∼900 deg C. The fabricated TFTs possess an ultra-thin NAOS SiO 2 /CVD SiO 2 stack gate dielectric structure. The ultrathin NAOS SiO 2 layer effectively blocks a gate leakage current, and thus, the thickness of the gate oxide layer can be decreased from 80 to 20 nm. The thin gate oxide layer enables to decrease the operation voltage to 2 V (cf. the conventional operation voltage of TFTs with 80 nm gate oxide: 12 V) because of the low threshold voltages, i.e., -0.5 V for P-ch TFTs and 0.5 V for N-ch TFTs, and thus the consumed power decreases to 1/36 of that of the conventional TFTs. The drain current increases rapidly with the gate voltage, and the sub-threshold voltage is ∼80 mV/dec. The low sub-threshold swing is attributable to the thin gate oxide thickness and low interface state density of the NAOS SiO 2 layer. (authors)

  2. Effects of post-deposition annealing on sputtered SiO2/4H-SiC metal-oxide-semiconductor

    Science.gov (United States)

    Lee, Suhyeong; Kim, Young Seok; Kang, Hong Jeon; Kim, Hyunwoo; Ha, Min-Woo; Kim, Hyeong Joon

    2018-01-01

    Reactive sputtering followed by N2, NH3, O2, and NO post-deposition annealing (PDA) of SiO2 on 4H-SiC was investigated in this study. The results of ellipsometry, an etching test, and X-ray photoemission spectroscopy showed that N2 and NH3 PDA nitrified the SiO2. Devices using N2 and NH3 PDA exhibited a high gate leakage current and low breakdown field due to oxygen vacancies and incomplete oxynitride. SiO2/4H-SiC MOS capacitors were also fabricated and their electrical characteristics measured. The average breakdown fields of the devices using N2, NH3, O2, and NO PDA were 0.12, 0.17, 4.71 and 2.63 MV/cm, respectively. The shifts in the flat-band voltage after O2 and NO PDA were 0.95 and -2.56 V, respectively, compared with the theoretical value. The extracted effective oxide charge was -4.11 × 1011 cm-2 for O2 PDA and 1.11 × 1012 cm-2 for NO PDA. NO PDA for 2 h at 1200 °C shifted the capacitance-voltage curve in the negative direction. The oxygen containing PDA showed better electrical properties than non-oxygen PDA. The sputtering method described can be applied to 4H-SiC MOS fabrication.

  3. Growth Stress in SiO2 during Oxidation of SiC Fibers (Preprint)

    Science.gov (United States)

    2011-11-01

    calculating the average self-pressure ( pav ) in the SiO2 scale throughout its thickness, as a function of total scale thickness (w), temperature, and fiber...2 ∑ p(bj2 − bj−12 )ij=1 [54] The average pressure ( pav ) was calculated for 6 and 3 µm...for public release; distribution unlimited. Fig. 13. Average SiO2 scale self-pressure ( pav ) for 6 and 3 µm radius fibers as a function of scale

  4. Fabrication of Nb2O5/SiO2 mixed oxides by reactive magnetron co-sputtering

    International Nuclear Information System (INIS)

    Juškevičius, Kęstutis; Audronis, Martynas; Subačius, Andrius; Kičas, Simonas; Tolenis, Tomas; Buzelis, Rytis; Drazdys, Ramutis; Gaspariūnas, Mindaugas; Kovalevskij, Vitalij; Matthews, Allan; Leyland, Adrian

    2015-01-01

    This paper investigates niobia/silica mixed oxide thin films deposited by reactive pulse-DC/RF magnetron co-sputtering of Nb and Si metal targets at room temperature. The reactive gas flow during the sputtering processes was either controlled by direct mass flow rate (i.e. constant reactive gas flow) or by an active feedback process control system. 61% and 137% higher deposition rates of Nb 2 O 5 and SiO 2 layers, respectively, were obtained using the latter technique as compared to constant reactive gas flow. Films exhibited bulk or near-bulk density. All mixture films produced in this study had an amorphous structure. A volume law of mixtures was used to determine the coating composition. It is shown that the fraction of SiO 2 or/and Nb 2 O 5 has a linear dependency on sputter target power density. On this basis, rugate filter coating designs can be easily deposited, where refractive index gradually varies between that of pure Nb 2 O 5 and pure SiO 2 . Substantially less inhomogeneity of coating mixtures was found in films produced using a reactive sputtering process with feedback-control. - Highlights: • 61% and 137% increase in deposition rates of Nb 2 O 5 and SiO 2 • Rugate coating designs can be readily deposited. • Nb 2 O 5 /SiO 2 mixture films exhibited bulk or near-bulk density. • Optimized process leads to stoichiometric and homogenous mixtures. • Films are amorphous and suitable for low loss optical coatings

  5. Transport properties of SiO2/AlInN/AlN/GaN metal-oxide-semiconductor high electron mobility transistors on SiC substrate

    Science.gov (United States)

    Lachab, M.; Sultana, M.; Fareed, Q.; Husna, F.; Adivarahan, V.; Khan, A.

    2014-04-01

    Unpassivated SiO2/AlInN/AlN/GaN metal-oxide-semiconductor high electron mobility transistors (MOSHEMTs) exhibiting a thin barrier layer are investigated with a particular focus on their dc characteristics dependence on the gate length. The epiwafer exhibits a sheet resistance of ˜250 Ω/□ and a channel charge density of 7.4 × 1012 cm-2 deduced from the 1 MHz capacitance-voltage curves. The results indicate that the thickness of the AlInN barrier can be reduced below 5 nm without degradation of the insulated gate devices performance. For transistors with gate lengths (LG) between 1.8 and 2.0 µm, dc drain saturation currents densities as high as 1.8 A mm-1 are achieved at +4 V gate-source bias (VGS) with very low reverse gate leakage currents. The electron zero-bias drift mobility was determined to be 1670 cm2 V-1 s-1 from the low-field channel conductance measurements. On the other side, using an analytical model it is found that the maximum output current density at VGS = 0 V can be enhanced by ˜23% when LG is scaled from 1.8 µm down to 100 nm. With further improvement of the quality of the gate insulating oxide layer and the implementation of surface passivation, both with the aim of suppressing the observed current collapse, the presented results suggest that these MOSHEMTs could become very attractive for the realization of high-power electronics.

  6. Investigation of pentacene growth on SiO2 gate insulator after photolithography for nitrogen-doped LaB6 bottom-contact electrode formation

    Science.gov (United States)

    Maeda, Yasutaka; Hiroki, Mizuha; Ohmi, Shun-ichiro

    2018-04-01

    Nitrogen-doped (N-doped) LaB6 is a candidate material for the bottom-contact electrode of n-type organic field-effect transistors (OFETs). However, the formation of a N-doped LaB6 electrode affects the surface morphology of a pentacene film. In this study, the effects of surface treatments and a N-doped LaB6 interfacial layer (IL) were investigated to improve the pentacene film quality after N-doped LaB6 electrode patterning with diluted HNO3, followed by resist stripping with acetone and methanol. It was found that the sputtering damage during N-doped LaB6 deposition on a SiO2 gate insulator degraded the crystallinity of pentacene. The H2SO4 and H2O2 (SPM) and diluted HF treatments removed the damaged layer on the SiO2 gate insulator surface. Furthermore, the N-doped LaB6 IL improved the crystallinity of pentacene and realized dendritic grain growth. Owing to these surface treatments, the hole mobility improved from 2.8 × 10‑3 to 0.11 cm2/(V·s), and a steep subthreshold swing of 78 mV/dec for the OFET with top-contact configuration was realized in air even after bottom-contact electrode patterning.

  7. IrO2-SiO2 binary oxide films: Preparation, physiochemical characterization and their electrochemical properties

    International Nuclear Information System (INIS)

    Wang Xiaomei; Hu Jiming; Zhang Jianqing

    2010-01-01

    Mixed IrO 2 -SiO 2 oxide films were prepared on titanium substrate by the thermo-decomposition of hexachloroiridate (H 2 IrCl 6 ) and tetraethoxysilane (TEOS) mixed precursors in organic solvents. The solution chemistry and thermal decomposition kinetics of the mixed precursors were investigated by ultra violet/visible (UV/vis) spectroscopy and thermogravimetry (TGA) and differential thermal analysis (DTA), respectively. The physiochemical characterization of the resulting materials was conducted by X-ray diffraction (XRD), scanning electron microscopy (SEM) and electrochemical measurements. It is shown from the UV/vis spectra that the electronic absorption intensity of IrCl 6 2- complexes in the precursors decreases in the presence of TEOS, indicating the interaction between these two components. Thermal analysis shows the decomposition reaction of H 2 IrCl 6 is inhibited by TEOS in the low temperature range, but the further oxidation reaction at high temperatures of formed intermediates is independent of the presence of silane component. Physical measurements show a restriction effect of silica on the crystallization and crystal growth processes of IrO 2 , leading to the formation of finer oxide particles and the porous morphology of the binary oxide films. The porous composite films exhibit high apparent electrocatalytic activity toward the oxygen evolution reaction. In addition, the long-term stability of Ti-supported IrO 2 electrodes is found to apparently improve with appropriate amount of SiO 2 incorporation, as tested under galvanostatic electrolysis.

  8. Removal of Hazardous Pollutants from Wastewaters: Applications of TiO2-SiO2 Mixed Oxide Materials

    Directory of Open Access Journals (Sweden)

    Shivatharsiny Rasalingam

    2014-01-01

    Full Text Available The direct release of untreated wastewaters from various industries and households results in the release of toxic pollutants to the aquatic environment. Advanced oxidation processes (AOP have gained wide attention owing to the prospect of complete mineralization of nonbiodegradable organic substances to environmentally innocuous products by chemical oxidation. In particular, heterogeneous photocatalysis has been demonstrated to have tremendous promise in water purification and treatment of several pollutant materials that include naturally occurring toxins, pesticides, and other deleterious contaminants. In this work, we have reviewed the different removal techniques that have been employed for water purification. In particular, the application of TiO2-SiO2 binary mixed oxide materials for wastewater treatment is explained herein, and it is evident from the literature survey that these mixed oxide materials have enhanced abilities to remove a wide variety of pollutants.

  9. Gate-tunable coherent transport in Se-capped Bi2Se3 grown on amorphous SiO2/Si

    International Nuclear Information System (INIS)

    Liu, Y. H.; Chong, C. W.; Huang, S. Y.; Jheng, J. L.; Huang, S. M.; Huang, J. C. A.; Li, Z.; Qiu, H.; Marchenkov, V. V.

    2015-01-01

    A topological insulator (TI) is an exotic material that has a bulk insulating gap and metallic surface states with unique spin-momentum locking characteristics. Despite its various important applications, large scale integration of TI into MOSFET technologies and its coherent transport study are still rarely explored. Here, we report the growth of high quality Bi 2 Se 3 thin film on amorphous SiO 2 /Si substrate using MBE. By controlling the thickness of the film at ∼7 nm and capping the as grown film in situ with a 2 nm-thick Se layer, largest electrostatic field effect is obtained and the resistance is changed by almost 300%. More importantly, pronounced gate-tunable weak antilocalization (WAL) is observed, which refers to modulation of α from ∼−0.55 to ∼−0.2 by applying a back gate voltage. The analysis herein suggests that the significant gate-tunable WAL is attributable to the transition from weak disorder into intermediate disorder regime when the Fermi level is shifted downward by increasing the negative back gate voltage. Our findings may pave the ways towards the development of TI-based MOSFET and are promising for the applications of electric-field controlled spintronic and magnetic device

  10. Interfacial charge trapping in extrinsic Y2O3/SiO2 bilayer gate dielectric based MIS devices on Si(100)

    Science.gov (United States)

    Rastogi, A. C.; Sharma, R. N.

    2001-08-01

    Metal-insulator-semiconductor (MIS) structures based on an extrinsic Y2O3 dielectric film on Si show high leakage currents due to roughness-related highly localized fields. Oxygen annealing increases the dielectric constant and strength and reduces leakage currents by transforming Y2O3 (film)/Si(100) into a bilayer Y2O3 (film)/SiO2/Si(100) dielectric structure. Evolution of interfacial SiO2 causes generation of mid-gap interface states at Ev + 0.23 eV and Ev + 0.43 eV, which act as electron traps and are responsible for hysteresis effects in capacitance-voltage (C-V) and current-voltage (I-V) behaviour in the accumulation-inversion modes. The electron trapping reduces the cathodic field and causes lowering of the current and the shift in current to higher fields after successive ramps. The charge trapping effects cause varied and unstable C-V and I-V behaviour of MIS structures based on a Y2O3/SiO2 bilayer gate dielectric. Its origin has been attributed to microstructure and defect state modification at the Y2O3 film-Si interface. This limits its application in high-density dynamic random access memory and ultra-large-scale integration devices.

  11. Influence of CO annealing in metal-oxide-semiconductor capacitors with SiO2 films thermally grown on Si and on SiC

    Science.gov (United States)

    Pitthan, E.; dos Reis, R.; Corrêa, S. A.; Schmeisser, D.; Boudinov, H. I.; Stedile, F. C.

    2016-01-01

    Understanding the influence of SiC reaction with CO, a by-product of SiC thermal oxidation, is a key point to elucidate the origin of electrical defects in SiC metal-oxide-semiconductor (MOS) devices. In this work, the effects on electrical, structural, and chemical properties of SiO2/Si and SiO2/SiC structures submitted to CO annealing were investigated. It was observed that long annealing times resulted in the incorporation of carbon from CO in the Si substrate, followed by deterioration of the SiO2/Si interface, and its crystallization as SiC. Besides, this incorporated carbon remained in the Si surface (previous SiO2/Si region) after removal of the silicon dioxide film by HF etching. In the SiC case, an even more defective surface region was observed due to the CO interaction. All MOS capacitors formed using both semiconductor materials presented higher leakage current and generation of positive effective charge after CO annealings. Such results suggest that the negative fixed charge, typically observed in SiO2/SiC structures, is not originated from the interaction of the CO by-product, formed during SiC oxidation, with the SiO2/SiC interfacial region.

  12. Modeling SiO2 Ion Impurities Aging in Insulated Gate Power Devices Under Temperature and Voltage Stress

    Data.gov (United States)

    National Aeronautics and Space Administration — This paper presents a formal computational methodology to explain how the oxide in semiconductors degrades over time and the dependence of oxide degradation on...

  13. Synthesis of silicon oxide microropes on the copper substrate with SiO2 interlayer

    Science.gov (United States)

    Baranov, E.; Khmel, S.; Zamchiy, A.; Shatskiy, E.

    2017-11-01

    Nanostructuring of the surface is a promising technology for the processes of boiling. In this paper, we synthesized array of “microropes” from silicon oxide nanowires on the copper substrate with a silicon oxide intermediate layer by gas-jet electron beam plasma CVD method. The morphology for the synthesis time of 2 minutes 30 seconds and 5 minutes was obtained. The water droplet on the silicon oxide nanowires shows the measured contact angles 14° and 10° for deposition times of 5 min and 2 min 30 sec, respectively.

  14. A novel composite of SiO2-coated graphene oxide and molecularly imprinted polymers for electrochemical sensing dopamine.

    Science.gov (United States)

    Zeng, Yanbo; Zhou, Ying; Kong, Lei; Zhou, Tianshu; Shi, Guoyue

    2013-07-15

    A novel imprinting route based on graphene oxide (GO) was proposed for preparing a composite of SiO2-coated GO and molecularly imprinted polymers (GO/SiO2-MIPs). In this route, SiO2-coated GO sheets were synthesized in a water-alcohol mixture with sol-gel technique. Prior to polymerization, the vinyl groups were introduced onto the surface of GO/SiO2 through chemical modification with γ-methacryloxypropyl trimethoxysilane (γ-MAPS), which can direct the selective polymerization on the GO/SiO2 surface. Then a novel composite of GO/SiO2-MIPs was successfully obtained by the copolymerization in presence of vinyl groups functionalized GO/SiO2, dopamine (DA), methacrylic acid and ethylene glycol dimethacrylate. The GO/SiO2-MIPs composite was characterized by FTIR, TGA, Raman spectroscopy, SEM and AFM. The properties such as special binding, adsorption dynamics and selective recognition ability using differential pulse voltammetry (DPV) were evaluated. The DPV current response of GO/SiO2-MIPs sensor was nearly 3.2 times that of the non-imprinted polymers (NIPs). In addition, the GO/SiO2-MIPs sensor could recognize DA from its relatively similar molecules of norepinephrine and epinephrine, while the sensors based on GO/SiO2-NIPs and vinyl groups functionalized GO/SiO2 did not have the ability. The GO/SiO2-MIPs sensor had a wide linear range over DA concentration from 5.0 × 10(-8) to 1.6 × 10(-4)M with a detection limit of 3.0 × 10(-8)M (S/N=3). The sensor based on this novel imprinted composite was applied to the determination of DA in injections and human urine samples with satisfactory results. Copyright © 2013 Elsevier B.V. All rights reserved.

  15. One-Step Synthesis of Hierarchical Micro-Mesoporous SiO2/Reduced Graphene Oxide Nanocomposites for Adsorption of Aqueous Cr(VI

    Directory of Open Access Journals (Sweden)

    Guiyun Yi

    2017-01-01

    Full Text Available A novel micro-mesostructured SiO2/reduced graphene oxide (RGO nanocomposite was successfully synthesized by means of simple one-step hydrothermal method under acidic conditions using tetraethoxysilane (TEOS and graphene oxide (GO as the raw material. The nanocomposites were characterized by TEM, XRD, FT-IR, TG-DSC, and N2 adsorption-desorption. The results showed that GO was partially reduced to RGO without adding any reducing agent and SiO2 nanoparticles (ca. 10 nm were uniformly anchored on the surface of RGO. The optimized composite contained 75 wt.% SiO2 and possessed hierarchical micro-mesoporous structure with surface area of 676 m2/g. The adsorption performance of synthesized SiO2/RGO samples was investigated by removal efficiency of Cr(VI ions in wastewater. The Cr(VI adsorption reached equilibrium in 30 min and 98.8% Cr(VI adsorption efficiency was achieved at pH = 2 at 35°C. Stability tests showed that SiO2 nanoparticles effectively prevented RGO from the restacking. The mechanisms of composite formation and for Cr(VI adsorption were suggested.

  16. Double thermal oxidation scheme for the fabrication of SiO2 nanochannels

    DEFF Research Database (Denmark)

    Persson, Karl Fredrik; Thamdrup, Lasse Højlund; Mikkelsen, Morten Bo Lindholm

    2007-01-01

    -of-the-art fabrication techniques, our double thermal oxidation scheme (DTOS) displays improvements with respect to 4 inch waferscale height variation sigma(h) 2500. We test the devices by measuring capillary filling speed in different channel heights, ranging from 14 to 310 nm. These tests reproduce as well as extend...

  17. Adsorptive kinetic mechanism of heavy metal cations on the surface of graphite oxide and its SiO2 composite

    Science.gov (United States)

    Sheet, Imtithal; Kabbani, Ahmad; Holail, Hanafy

    2017-02-01

    Nanomaterials have gained great attention because of their novel size- and shape-dependent properties, large specific surface area and high reaction activity. Moreover, nanomaterials have a wide range of applications, as in the technological and environmental challenges in the areas of solar energy conversion, catalysis, medicine, and water treatments. In the present study, nanostructured graphite oxide, silica/graphite oxide composites and silica nanoparticles were used for the removal of the heavy metal ions from aqueous solutions by a batch adsorption method and the adsorptive kinetic mechanism of heavy metal cations on the surface of graphite oxide and its SiO2 composite was evaluated. The experimental results revealed a strong adsorption of the metal cations on the surface of graphite oxide, this is reflected in the shifts in wave numbers after adsorption with nanostructured graphite oxide and the big shift in wave numbers (Δv¯) for nickel ions reflects chemosorption type of adsorption. This is confirmed by the coherence between Δv¯, removal percentage and crystal field stabilization energy (CFSE). Silica/ GO (2:3) composite showed the greatest removal percentage at different concentrations compared to pure graphite oxide and silica nanoparticles. The higher removal percentage of nickel ions by silica /GO composite (2:3) was observed at 180 min contact time and basic pH. The kinetic studies showed that silica/ GO (2:3) composite had rapid adsorption rate and efficiency and it was found to follow first order rate expression or an exponential decay of the metal cations from water study.

  18. Metabolomic effects of CeO2, SiO2 and CuO metal oxide nanomaterials on HepG2 cells

    Data.gov (United States)

    U.S. Environmental Protection Agency — The data set is a matrix of cellular biochemical (metabolites) in HepG2 cells treated with various metal oxide nanomaterials composed of CeO2, SiO2 and CuO. This...

  19. Influence of SiO2and graphene oxide nanoparticles on efficiency of biological removal process.

    Science.gov (United States)

    Esmaeili-Faraj, Seyyed Hamid; Nasr Esfahany, Mohsen

    2017-11-01

    The effects of the presence of synthesized silica (SS) and exfoliated graphene oxide (EGO) on the removal of sulfide ion with activated sludge (AS) are experimentally investigated. The maximum removal efficiency of sulfide ion for AS without nanoparticles, and the samples with SS and EGO nanoparticles were 81%, 88% and 79%, respectively. Moreover, the maximum elimination capacity (EC max ) for the bioreactor with SS-nanoparticles is 7542 mg/L s, while the EC max of AS and EGO samples were 7075 and 6625 mg/L s, respectively. Two filamentous microbial strains as Gram-negative and Gram-positive bacteria are discerned that removed sulfide ion in the presence of nanoparticles. The measurement of mixture liquor volatile suspended solid that indicates the biomass growth rate during the test shows that the bioreactor containing SS-nanoparticles has more biomass content than the other samples. Our findings indicate that SS-nanoparticles with 0.1% wt. concentration in the bioreactor have no negative effects on the efficiency of the biological removal of sulfide and the presence of SS-nanoparticles even enhances the performance of the bioreactor. On the other side, a bioreactor with EGO nanosheets, as highly antibacterial nanoparticles, with 0.02% wt. concentration significantly influences the microbial growth and reduces sulfide removal efficiency.

  20. Fe3O4@SiO2@CS-TETA functionalized graphene oxide for the adsorption of methylene blue (MB) and Cu(II)

    Science.gov (United States)

    Wang, Fan; Zhang, Lijuan; Wang, Yeying; Liu, Xijian; Rohani, Sohrab; Lu, Jie

    2017-10-01

    The graphene oxide (GO) functionalized by Fe3O4@SiO2@CS-TETA nanoparticles, Fe3O4@SiO2@CS-TETA-GO, was firstly fabricated in a mild way as a novel adsorbent for the removal of Cu(II) ions and methylene blue (MB) from aqueous solutions. The magnetic composites showed a good dispersity in water and can be conveniently collected for reuse through magnetic separation due to its excellent magnetism. When the Fe3O4@SiO2@CS- TETA-GO was used as an absorbent for the absorption of MB and Cu(II), the adsorption kinetics and isotherms data well fitted the pseudo-second-order model and the Langmuir model, respectively. Under the optimized pH and initial concentration, the maximum adsorption capacity was about 529.1 mg g-1 for MB in 20 min and 324.7 mg g-1 for Cu(II) in 16 min, respectively, exhibiting a better adsorption performance than other GO-based adsorbents reported recently. More importantly, the synthesized adsorbent could be effectively regenerated and repeatedly utilized without significant capacity loss after six times cycles. All the results demonstrated that Fe3O4@SiO2@CS-TETA-GO could be used as an excellent adsorbent for the adsorption of Cu(II) and MB in many fields.

  1. Role of mobile interstitial oxygen atoms in defect processes in oxides: Interconversion between oxygen-associated defects in SiO2 glass

    International Nuclear Information System (INIS)

    Kajihara, Koichi; Hirano, Masahiro; Skuja, Linards; Hosono, Hideo

    2004-01-01

    The role of mobile interstitial oxygen atoms (O 0 ) in defect processes in oxides is demonstrated by interconversion between the oxygen dangling bond and the peroxy radical (POR) in SiO 2 glass. Superstoichiometric O 0 was created by F 2 laser photolysis of the interstitial O 2 . On annealing above 300 deg. C, O 0 migrated and converted the oxygen dangling bond to POR. Exposure to 5.0 eV light converted POR back to a pair of the oxygen dangling bond and O 0 (quantum yield: ∼0.1). These findings suggest that various defect processes typically occurring in SiO 2 glass at ∼300-500 deg. C are related to migration of O 0 , which exists in the glass network in the peroxy linkage form

  2. Preparation and characterization of amorphous SiO2 coatings deposited by mirco-arc oxidation on sintered NdFeB permanent magnets

    International Nuclear Information System (INIS)

    Xu, J.L.; Xiao, Q.F.; Mei, D.D.; Zhong, Z.C.; Tong, Y.X.; Zheng, Y.F.; Li, L.

    2017-01-01

    Amorphous SiO 2 coatings were prepared on sintered NdFeB magnets by micro-arc oxidation (MAO) in silicate solution. The surface and cross-sectional morphologies, element and phase composition, corrosion resistance and magnetic properties of the coatings were investigated by scanning electron microscopy (SEM), energy dispersive X-ray spectrometer (EDS), X-ray photoelectron spectroscopy (XPS), potentiodynamic polarization test and physical properties measurements system (PPMS). The results showed that the surface morphologies of the coatings exhibited the “coral reef” like structure, different from the typical MAO porous structure. With increasing the voltages, the thickness of the coatings increased from 12.72 to 19.90 µm, the content of Si element increased, while the contents of Fe, Nd and P elements decreased. The coatings were mainly composed of amorphous SiO 2 and a few amorphous Fe 2 O 3 and Nd 2 O 3 . The amorphous SiO 2 coatings presented excellent thermal shock resistance, while the thermal shock resistance decreased with increasing the voltages. The corrosion resistance of the coatings increased with increasing the voltages, and it could be enhanced by one order of magnitude compared to the uncoated NdFeB magnets. The MAO coatings slightly decreased the magnetic properties of the NdFeB samples in different degrees. - Highlights: • Amorphous SiO 2 coatings were prepared on sintered NdFeB magnets by micro-arc oxidation. • The coatings presented excellent thermal shock resistance. • The corrosion resistance could be enhanced by one order of magnitude. • The MAO coatings slightly decreased the magnetic properties of the NdFeB samples.

  3. Preparation and characterization of amorphous SiO2 coatings deposited by mirco-arc oxidation on sintered NdFeB permanent magnets

    Science.gov (United States)

    Xu, J. L.; Xiao, Q. F.; Mei, D. D.; Zhong, Z. C.; Tong, Y. X.; Zheng, Y. F.; Li, L.

    2017-03-01

    Amorphous SiO2 coatings were prepared on sintered NdFeB magnets by micro-arc oxidation (MAO) in silicate solution. The surface and cross-sectional morphologies, element and phase composition, corrosion resistance and magnetic properties of the coatings were investigated by scanning electron microscopy (SEM), energy dispersive X-ray spectrometer (EDS), X-ray photoelectron spectroscopy (XPS), potentiodynamic polarization test and physical properties measurements system (PPMS). The results showed that the surface morphologies of the coatings exhibited the "coral reef" like structure, different from the typical MAO porous structure. With increasing the voltages, the thickness of the coatings increased from 12.72 to 19.90 μm, the content of Si element increased, while the contents of Fe, Nd and P elements decreased. The coatings were mainly composed of amorphous SiO2 and a few amorphous Fe2O3 and Nd2O3. The amorphous SiO2 coatings presented excellent thermal shock resistance, while the thermal shock resistance decreased with increasing the voltages. The corrosion resistance of the coatings increased with increasing the voltages, and it could be enhanced by one order of magnitude compared to the uncoated NdFeB magnets. The MAO coatings slightly decreased the magnetic properties of the NdFeB samples in different degrees.

  4. Ni nanoparticles decorated onto graphene oxide with SiO2 as interlayer for high performance on histidine-rich protein separation

    Science.gov (United States)

    Yang, Xiaodan; Zhang, Min; Zheng, Jing; Li, Weizhen; Gan, Wenjun; Xu, Jingli; Hayat, Tasawar; Alharbi, Njud S.; Yang, Fan

    2018-05-01

    Sandwich-like structure of graphene oxide (GO) @SiO2@C-Ni nanosheets were prepared by combining an extended stöber method with subsequent carbonization treatment, in which polydopamine was used as reducing agent and carbon source. Firstly, the GO nanosheets were covered with SiO2 interlayer and finally coated with a outer shell of nickel ion doped polydopamine (PDA-Ni2+) with an extended stöber method. Followed by a carbonization to produce the GO@SiO2@C-Ni sheets with metallic nickel nanoparticles embedded in PDA-derived thin graphic carbon layer. Notably, silica interlayer played a vital role in the formation of such GO@SiO2@C-Ni sheets. Without the protection of SiO2, the hydrophobic graphene@C-Ni composites were obtained instead. While with silica layer as the spacer, the obtained hydrophilic GO@SiO2@C-Ni composites were not only well dispersed in the solution, but also can be adjusted in terms of the size and density of Ni nanoparticles (NPs) on surface by changing the calcination temperature or the molar ratio between dopamine and nickel salt. Furthermore, nickel nanoparticles decorated on GO@SiO2 sheets were employed to enrich His-rich proteins (BHb and BSA) via specific metal affinity force between polyhistidine groups and nickel nanoparticles.

  5. Nanoscale gadolinium oxide capping layers on compositionally variant gate dielectrics

    KAUST Repository

    Alshareef, Husam N.

    2010-11-19

    Metal gate work function enhancement using nanoscale (1.0 nm) Gd2O3 interfacial layers has been evaluated as a function of silicon oxide content in the HfxSiyOz gate dielectric and process thermal budget. It is found that the effective work function tuning by the Gd2O3 capping layer varied by nearly 400 mV as the composition of the underlying dielectric changed from 0% to 100% SiO2, and by nearly 300 mV as the maximum process temperature increased from ambient to 1000 °C. A qualitative model is proposed to explain these results, expanding the existing models for the lanthanide capping layer effect.

  6. Selective Dispersive Solid Phase Extraction of Ser-traline Using Surface Molecularly Imprinted Polymer Grafted on SiO2/Graphene Oxide

    Directory of Open Access Journals (Sweden)

    Faezeh Khalilian

    2017-01-01

    Full Text Available A surface molecularly imprinted dispersive solid phase extraction coupled with liquid chromatography–ultraviolet detection is proposed as a selective and fast clean-up technique for the determination of sertraline in biological sample. Surface sertraline-molecular imprinted polymer was grafted and synthesized on the SiO2/graphene oxide surface. Firstly SiO2 was coated on synthesized graphene oxide sheet using sol-gel technique. Prior to polymerization, the vinyl group was incorporated on to the surface of SiO2/graphene oxide to direct selective polymerization on the surface. Methacrylic acid, ethylene glycol dimethacrylate and ethanol were used as monomer, cross-linker and progen, respectively. Non-imprinted polymer was also prepared for comparing purposes. The properties of the molecular imprinted polymer were characterized using field emission-scanning electron microscopy and Fourier transform infrared spectroscopy methods. The surface molecular imprinted polymer was utilized as an adsorbent of dispersive solid phase extraction for separation and preconcentration of sertraline. The effects of the different parameters influencing the extraction efficiency, such as sample pH were investigated and optimized. The specificity of the molecular imprinted polymer over the non-imprinted polymer was examined in absence and presence of competitive drugs. Sertraline calibration curve showed linearity in the ranges 1–500 µg L-1. The limits of detection and quantification under optimized conditions were obtained 0.2 and 0.5 µg L-1. The within-day and between-day relative standard deviations (n=3 were 4.3 and 7.1%, respectively. Furthermore, the relative recoveries for spiked biological samples were above 92%.

  7. Band alignments and improved leakage properties of (La2O3)0.5(SiO2)0.5/SiO2/GaN stacks for high-temperature metal-oxide-semiconductor field-effect transistor applications

    Science.gov (United States)

    Gao, L. G.; Xu, B.; Guo, H. X.; Xia, Y. D.; Yin, J.; Liu, Z. G.

    2009-06-01

    The band alignments of (La2O3)0.5(SiO2)0.5(LSO)/GaN and LSO/SiO2/GaN gate dielectric stacks were investigated comparatively by using x-ray photoelectron spectroscopy. The valence band offsets for LSO/GaN stack and LSO/SiO2/GaN stack are 0.88 and 1.69 eV, respectively, while the corresponding conduction band offsets are found to be 1.40 and 1.83 eV, respectively. Measurements of the leakage current density as function of temperature revealed that the LSO/SiO2/GaN stack has much lower leakage current density than that of the LSO/GaN stack, especially at high temperature. It is concluded that the presence of a SiO2 buffer layer increases band offsets and reduces the leakage current density effectively.

  8. Effect of SiO2-acryl nanohybrid coating layers on transparent conducting oxide-poly(ethylene terephthalate) superstrate.

    Science.gov (United States)

    Kang, Y T; Kang, D P; Kang, D J; Chung, I D

    2013-05-01

    SiO2-acryl nanohybrid coating layers were produced by hybridizing acrylic resin and surface-modified colloidal silica (CS) nanoparticles. First, CS nanoparticles were modified with methyltrimethoxysilane (MTMS) and vinyltrimethoxysilane (VTMS) by a sol-gel process. The surface-modified CS nanoparticles were then solvent-exchanged to be homogeneous in acrylic resin. The Hybrid materials were mixed in variation with the amount of surface-modified CS nanoparticles, coated with poly(ethylene terephthalate) (PET), then finally cured by UV light to obtain a hybrid coating layer. Field emission scanning electron microscopy (FE-SEM), particle size analysis (using a Zetasizer), and atomic force microscopy (AFM) were performed to determine the morphology of the hybrid thin-films. Thermogravimetric analysis (TGA) was used to investigate the thermal properties. Fourier-transform infrared (FTIR), ultraviolet-visible (UVNis) spectroscopies, and pencil hardness were used to obtain the details of chemical structures, optical properties, and hardness, respectively. The hybrid thin films had shown to be enhanced properties compared to their urethane acrylate prepolymer (UAP) coating film.

  9. Preparation of Graphene Oxide Decorated Fe3O4@SiO2 Nanocomposites with Superior Adsorption Capacity and SERS Detection for Organic Dyes

    Directory of Open Access Journals (Sweden)

    Song Yang

    2015-01-01

    Full Text Available The fast detection and removal of organic dyes from contaminated water has become an urgent environmental issue due to their high toxicity, chemical stability, and low biodegradability. In this paper, we have developed graphene oxide decorated Fe3O4@SiO2 (Fe3O4@SiO2-GO as a novel adsorbent aiming at the rapid adsorption and trace analysis of organic dyes followed by surface enhanced Raman scattering (SERS. The structure and morphology of the nanocomposites were characterized by transmission electron microscopy (TEM, Fourier infrared spectrometry (FT-IR, X-ray diffraction (XRD, and vibrating sample magnetometer (VSM. The obtained nanocomposites were used to adsorb methylene blue (MB in aqueous solution based on π-π stacking interaction and electrostatic attraction between MB and GO, and the adsorption behaviors of MB were investigated. Moreover, the obtained nanocomposites with adsorbed dyes were separated from the solution and loaded with silver nanoparticles for SERS detection. These nanocomposites showed superior SERS sensitivity and the lowest detectable concentration was 1.0 × 10−7 M.

  10. Dielectric strength of SiO2 in a CMOS transistor structure

    International Nuclear Information System (INIS)

    Soden, J.M.

    1979-01-01

    The distribution of experimental dielectric strengths of SiO 2 gate dielectric in a CMOS transistor structure is shown to be composed of a primary, statistically-normal distribution of high dielectric strength and a secondary distribution spread through the lower dielectric strength region. The dielectric strength was not significantly affected by high level (1 x 10 6 RADS (Si)) gamma radiation or high temperature (200 0 C) stress. The primary distribution breakdowns occurred at topographical edges, mainly at the gate/field oxide interface, and the secondary distribution breakdowns occurred at random locations in the central region of the gate

  11. Interfacial Tension in the CaO-Al2O3-SiO2-(MgO) Liquid Slag-Solid Oxide Systems

    Science.gov (United States)

    Abdeyazdan, Hamed; Monaghan, Brian J.; Longbottom, Raymond J.; Rhamdhani, M. Akbar; Dogan, Neslihan; Chapman, Michael W.

    2017-08-01

    Interfacial phenomenon is critical in metal processing and refining. While it is known to be important, there are little data available for key oxide systems in the literature. In this study, the interfacial tension ( σ LS) of liquid slag on solid oxides (alumina, spinel, and calcium aluminate), for a range of slags in the CaO-Al2O3-SiO2-(MgO) system at 1773 K (1500 °C), has been evaluated. The results show that basic ladle-type slags exhibit lower σ LS with oxide phases examined compared to that of acid tundish-type slags. Also, within the slag types (acid and base), σ LS was observed to decrease with increasing slag basicity. A correlation between σ LS and slag structure was observed, i.e., σ LS was found to decrease linearly with increasing of slag optical basicity (Λ) and decrease logarithmically with decreasing of slag viscosity from acid to base slags. This indicated a higher σ LS as the ions in the slag become larger and more complex. Through a work of adhesion ( W) analysis, it was shown that basic ladle slags with lower σ LS result in a greater W, i.e., form a stronger bond with the solid oxide phases examined. This indicates that all other factors being equal, the efficiency of inclusion removal from steel of inclusions of similar phase to these solid oxides would be greater.

  12. Investigation of Leakage Current Mechanisms in La2O3/SiO2/4H-SiC MOS Capacitors with Varied SiO2 Thickness

    Science.gov (United States)

    Wang, Yucheng; Jia, Renxu; Zhao, Yanli; Li, Chengzhan; Zhang, Yuming

    2016-11-01

    In this study, the material and electrical properties of La2O3/SiO2/4H-SiC metal-oxide-semiconductor (MOS) capacitors are systematically characterized. Thermal oxidization SiO2 with varying thickness (0 nm, 3.36 nm, 5 nm, 8 nm, and 30 nm) were coated with La2O3 using atomic layer deposition on n-type 4H-SiC. The stacking oxides were measured using atomic force microscopy, transmission electron microscopy, and x-ray photoelectron spectroscopy, and the MOS capacitors were measured by capacitance-voltage and current-voltage measurements. The results demonstrate that the main gate current leakage mechanisms are dependent on the thickness of the SiO2 oxide under the applied electric field. The primary mechanism for current leakage from the La2O3/4H-SiC MOS capacitor follows the Schottky emission mechanism due to its low conduction band offset. In contrast, the current leakage mechanism for the capacitor with a 3.36 nm SiO2 layer follows the Poole-Frenkel emission mechanism on account of its high trap charge density in the gate dielectric and at the interface. When the thickness of the SiO2 layer increases to 8 nm, lower leakage current is observed by reason of the low trap charge density and high conduction band offset when E ≤ 5 MV/cm. As the electric field strength increases to 5 MV/cm and 5.88 MV/cm (30 nm SiO2: 4.8 MV/cm), the main current leakage mechanism changes to the Fowler-Nordheim tunneling mechanism, which indicates that the La2O3/SiO2 stacking structure can improve the properties of MOS capacitors.

  13. Effect of SiO 2 3–/OH–on plasma electrolytic oxidation of Ti–5Mo–4V ...

    Indian Academy of Sciences (India)

    Plasma electrolyte oxidation (PEO) was utilized to produce thick films on titanium and Ti–5Mo–4V–3Al alloys by immersing them in various solutions of Na2SiO3 and KOH with different concentrations to investigate the effect of SiO 3 2 − /OH– relations on the morphology and formed phases by utilizing SEM and XRD.

  14. Thiophene Conversion and Ethanol Oxidation on SiO2-Supported 12-PMoV-Mixed Heteropoly Compounds

    Czech Academy of Sciences Publication Activity Database

    Spojakina, A. A.; Kostova, N. G.; Sow, Bineta; Stamenova, M. W.; Jirátová, Květa

    2001-01-01

    Roč. 65, 2-4 (2001), s. 315-321 ISSN 0920-5861 Institutional research plan: CEZ:AV0Z4072921 Keywords : thiophene conversion * ethanol oxidation * mixed heteropoly compounds Subject RIV: CI - Industrial Chemistry, Chemical Engineering Impact factor: 2.333, year: 2001

  15. Influence of the zirconium and titanium oxides on bioactivity of materials constituted by Na2O-CaO-P2O5-SiO2

    Directory of Open Access Journals (Sweden)

    Silvia Denofre de Campos

    2012-02-01

    Full Text Available In this work were synthesized by conventional fusion, biomaterials based on Na2O-CaO-P2O5-SiO2 with titanium oxide and zirconium oxide at different concentrations. The bioglasses, when submitted to the heat treatment in the crystallization temperatures, obtained by Differential Thermal Analysis (DTA showed an internal reorganization indicated by the presence of different crystalline phases observed in X-ray diffraction patterns of the samples. These crystalline phases, rich in calcium phosphates and calcium silicates, are probably the actives sites useful to the ion exchange process between solid and solution to apatite and hydroxyapatite formation, being responsible by bioactive behavior. Biocompatibility tests for the synthesized materials were made by placing the samples in contact with a solution simulating the blood plasma (SBP. There was a variation of the initial pH of this solution to the more basic pH (from 8.5 to 12.0, indicating the interaction between the solid and the SBP solution. This effect was more pronounced to materials with TiO2 that can be understood as a greater bioactivity and compatibility on these materials.

  16. Improvements of photocurrent by using modified SiO(2) in the poly(ether urethane)/poly(ethylene oxide) polymer electrolyte for all-solid-state dye-sensitized solar cells.

    Science.gov (United States)

    Zhou, Yanfang; Xiang, Wanchun; Chen, Shen; Fang, Shibi; Zhou, Xiaowen; Zhang, Jingbo; Lin, Yuan

    2009-07-14

    Nanocomposite polymer electrolytes containing poly(ether urethane) (PEUR)/poly(ethylene oxide) (PEO)/modified SiO(2) were prepared for all-solid-state dye-sensitized solar cells with a high efficiency of 4.86% and an active area of 0.25 cm(2) under AM1.5 conditions at 100 mW cm(-2) irradiation.

  17. Role of the SiO2 buffer layer thickness in the formation of Si/SiO2/nc-Ge/SiO2 structures by dry oxidation

    International Nuclear Information System (INIS)

    Kling, A.; Ortiz, M.I.; Prieto, A.C.; Rodriguez, A.; Rodriguez, T.; Jimenez, J.; Ballesteros, C.; Soares, J.C.

    2006-01-01

    Nanomemories, containing Ge-nanoparticles in a SiO 2 matrix, can be produced by dry thermal oxidation of a SiGe layer deposited onto a Si-wafer with a barrier SiO 2 layer on its top. Rutherford backscattering spectrometry has been used to characterize the kinetics of the oxidation process, the composition profile of the growing oxide, the Ge-segregation and its diffusion into the barrier oxide in samples with thin and thick barrier oxide layers. The Ge segregated during the oxidation of the SiGe layer diffuses into the barrier oxide. In the first case the diffusion through the thin oxide is enhanced by the proximity of the substrate that acts as a sink for the Ge, resulting in the formation of a low Ge concentration SiGe layer in the surface of the Si-wafer. In the second case, the Ge-diffusion progresses as slowly as in bulk SiO 2 . Since barrier oxide layers as thin as possible are favoured for device fabrication, the structures should be oxidized at lower temperatures and the initial SiGe layer thickness reduced to minimize the Ge-diffusion

  18. Metalloporphyrins immobilized in Fe3O4@SiO2 mesoporous submicrospheres: Reusable biomimetic catalysts for hydrocarbon oxidation.

    Science.gov (United States)

    Barbosa, Isaltino A; de Sousa Filho, Paulo C; da Silva, Douglas L; Zanardi, Fabrício B; Zanatta, Lucas D; de Oliveira, Adilson J A; Serra, Osvaldo A; Iamamoto, Yassuko

    2016-05-01

    We successfully immobilized metalloporphyrins (MeP) in mesoporous silica coating magnetite spheres. In this sense, we prepared two different classes of core@shell supports, which comprise aligned (Fe3O4-AM-MeP, MeP=FeP or MnP) and non-aligned (Fe3O4-NM-MeP, MeP=FeP or MnP) mesoporous magnetic structures. X-ray diffractometry and energy dispersive X-ray spectroscopy confirmed the mesoporous nature of the silica shell of the materials. Magnetization measurements, scanning and transmission electron microscopies (SEM/TEM), electrophoretic mobility (ζ-potential), and infrared spectroscopy (FTIR) also confirm the composition and structure of the materials. The catalysts maintained their catalytic activity during nine reaction cycles toward hydrocarbon oxidation processes without detectable catalyst leaching. The catalysis results revealed a biomimetic pattern of cytochrome P450-type enzymes, thus confirming that the prepared materials are can effectively mimic the activity of such groups. Copyright © 2016 Elsevier Inc. All rights reserved.

  19. Molecular-beam-deposited yttrium-oxide dielectrics in aluminum-gated metal - oxide - semiconductor field-effect transistors: Effective electron mobility

    International Nuclear Information System (INIS)

    Ragnarsson, L.-A degree.; Guha, S.; Copel, M.; Cartier, E.; Bojarczuk, N. A.; Karasinski, J.

    2001-01-01

    We report on high effective mobilities in yttrium-oxide-based n-channel metal - oxide - semiconductor field-effect transistors (MOSFETs) with aluminum gates. The yttrium oxide was grown in ultrahigh vacuum using a reactive atomic-beam-deposition system. Medium-energy ion-scattering studies indicate an oxide with an approximate composition of Y 2 O 3 on top of a thin layer of interfacial SiO 2 . The thickness of this interfacial oxide as well as the effective mobility are found to be dependent on the postgrowth anneal conditions. Optimum conditions result in mobilities approaching that of SiO 2 -based MOSFETs at higher fields with peak mobilities at approximately 210 cm 2 /Vs. [copyright] 2001 American Institute of Physics

  20. SiO2-coated magnetic graphene oxide modified with polypyrrole-polythiophene: A novel and efficient nanocomposite for solid phase extraction of trace amounts of heavy metals.

    Science.gov (United States)

    Molaei, Karam; Bagheri, Hasan; Asgharinezhad, Ali Akbar; Ebrahimzadeh, Homeira; Shamsipur, Mojtaba

    2017-05-15

    The synthesis of a novel nanocomposite comprised of SiO 2 -coated magnetic graphene oxide modified with a pyrrole-thiophene (mGO/SiO 2 @coPPy-Th) copolymer is reported in the present work. The nanocomposite was applied for the fast magnetic solid phase extraction (MSPE) of trace levels of copper, lead, chromium, zinc and cadmium from water and agricultural samples. The nanocomposite was prepared in three steps: (1) decoration of graphene oxide sheets with magnetite nanoparticles thorough a facile one-step chemical reaction strategy; (2) chemical grafting by a silica layer to obtain high stability in acidic solutions; and (3) surface modification by coPPy-Th via simultaneous oxidation polymerization of pyrrole and thiophene in the presence of mGO/SiO 2 composite. The nanocomposite was subsequently characterized by transmission electron microscopy (TEM), scanning electron microscopy (SEM), Fourier transform infrared spectroscopy (FT-IR), X-ray powder diffraction (XRD) and vibrating sample magnetometry (VSM) techniques. Several important experimental variables that could affect MSPE performance, including the pH of the sample, sorption time, sorbent dosage, eluent type and its concentration, eluent volume and elution time, were investigated and optimized. Under optimal conditions, the limits of detection for the target heavy metals ranged from 0.15 to 0.65μgL -1 . The maximum sorption capacity of the mGO/SiO 2 @coPPy-Th nanocomposite was 201, 230, 125, 98 and 80mgg -1 for Cu(II), Pb(II), Zn(II), Cr(III) and Cd(II), respectively. Finally, the feasibility of the proposed method was investigated for the extraction and determination of the target metals from real matrices. Copyright © 2017 Elsevier B.V. All rights reserved.

  1. Observing the semiconducting band-gap alignment of MoS2 layers of different atomic thicknesses using a MoS2/SiO2/Si heterojunction tunnel diode

    NARCIS (Netherlands)

    Nishiguchi, K.; Castellanos-Gomez, A.; Yamaguchi, H.; Fujiwara, A.; Van der Zant, H.S.J.; Steele, G.A.

    2015-01-01

    We demonstrate a tunnel diode composed of a vertical MoS2/SiO2/Si heterostructure. A MoS2 flake consisting four areas of different thicknesses functions as a gate terminal of a silicon field-effect transistor. A thin gate oxide allows tunneling current to flow between the n-type MoS2 layers and

  2. HfSiO/SiO2- and SiO2/HfSiO/SiO2-gate stacks for non-volatile memories

    International Nuclear Information System (INIS)

    Erlbacher, T.; Jank, M.P.M.; Lemberger, M.; Bauer, A.J.; Ryssel, H.

    2008-01-01

    The use of hafnium silicate (HfSiO) as a charge trapping layer in charge-based non-volatile memory cells will be discussed. First, fundamental properties (e.g., dielectric constant, trap depths/levels) of the hafnium silicate layers, deposited from a single-source precursor, are deduced from capacitance-voltage and current density-voltage measurements. The oxide trap density of the analyzed HfSiO layers can be tuned to exceed that of silicon nitride. At the same time, a significant reduction of the write voltage is achieved due to a reduced effective oxide thickness. The erase operation, however, is hampered by the lower electric field at the HfSiO layer due to its high dielectric constant. Measurements also indicate that HfSiO exposed to a higher thermal budget during device fabrication results in fewer trapping centers. Retention measurements show that information can be reliably stored in memory cells with a trapping layer of HfSiO for more than 10 years similar to their silicon nitride counterparts. But the thickness of the top and bottom oxides must be increased for compensation of additional charge losses which are due to lower trap depth and free electron mass in HfSiO

  3. High performance a-IGZO thin-film transistors with mf-PVD SiO2 as an etch-stop-layer

    NARCIS (Netherlands)

    Nag, M.; Steudel, S.; Bhoolokam, A.; Chasin, A.; Rockele, M.; Myny, K.; Maas, J.; Fritz, T.; Trube, J.; Groeseneken, G.; Heremans, P.

    2014-01-01

    In this work, we report on high-performance bottom-gate top-contact (BGTC) amorphous-Indium-Gallium-Zinc-Oxide (a-IGZO) thin-film transistor (TFT) with SiO2 as an etch-stop-layer (ESL) deposited by medium frequency physical vapor deposition (mf-PVD). The TFTs show field-effect mobility (μFE) of

  4. Synthesis and Characterization of CeO2-SiO2 Nanoparticles by Microwave-Assisted Irradiation Method for Photocatalytic Oxidation of Methylene Blue Dye

    Directory of Open Access Journals (Sweden)

    R. M. Mohamed

    2012-01-01

    Full Text Available CeO2-SiO2 nanoparticles were synthesized for the first time by a facile microwave-assisted irradiation process. The effect of irradiation time of microwave was studied. The materials were characterized by N2 adsorption, XRD, UV-vis/DR, and TEM. All solids showed mesoporous textures with high surface areas, relatively small pore size diameters, and large pore volume. The X-ray diffraction results indicated that the as-synthesized nanoparticles exhibited cubic CeO2 without impurities and amorphous silica. The transmission electron microscopy (TEM images revealed that the particle size of CeO2-SiO2 nanoparticles, which were prepared by microwave method for 30 min irradiation times, was around 8 nm. The photocatalytic activities were evaluated by the decomposition of methylene blue dye under UV light irradiations. The results showed that the irradiation under the microwave produced CeO2-SiO2 nanoparticles, which have the best crystallinity under a shorter irradiation time. This indicates that the introduction of the microwave really can save energy and time with faster kinetics of crystallization. The sample prepared by 30 min microwave irradiation time exhibited the highest photocatalytic activity. The photocatalytic activity of CeO2-SiO2 nanoparticles, which were prepared by 30 min irradiation times was found to have better performance than commercial reference P25.

  5. Metabolomic effects of CeO2, SiO2 and CuO metal oxide nanomaterials on HepG2 cells

    Science.gov (United States)

    Abstract Background To better assess potential hepatotoxicity of nanomaterials, human liver HepG2 cells were exposed for 3 days to five different CeO2 (either 30 or 100 μg/ml), 3 SiO2 based (30 μg/ml) or 1 CuO (3 μg/ml) nanomaterials with dry primary particle sizes r...

  6. Comparative Study of Catalytic Oxidation of Ethanol to Acetaldehyde Using Fe(III Dispersed on Sb2O5 Grafted on SiO2 and on Untreated SiO2 Surfaces

    Directory of Open Access Journals (Sweden)

    Benvenutti Edilson V.

    1998-01-01

    Full Text Available Fe(III was supported on Sb(V oxide grafted on the silica gel surface and directly on the silica gel surface using ion-exchange and impregnation processes producing Fe/Sb/SiO2 and Fe/SiO2, respectively. The catalytic conversion of ethanol to acetaldehyde was much more efficient using Fe/Sb/SiO2 than Fe/SiO2 as catalyst. This higher efficiency of the former catalyst takes into account two aspects: a the new phase FeSbO4 formed when Fe/Sb/SiO2 is heat treated and, b it is higher dispersion on the matrix.

  7. Electronic States of High-k Oxides in Gate Stack Structures

    Science.gov (United States)

    Zhu, Chiyu

    In this dissertation, in-situ X-ray and ultraviolet photoemission spectroscopy have been employed to study the interface chemistry and electronic structure of potential high-k gate stack materials. In these gate stack materials, HfO2 and La2O3 are selected as high-k dielectrics, VO2 and ZnO serve as potential channel layer materials. The gate stack structures have been prepared using a reactive electron beam system and a plasma enhanced atomic layer deposition system. Three interrelated issues represent the central themes of the research: 1) the interface band alignment, 2) candidate high-k materials, and 3) band bending, internal electric fields, and charge transfer. 1) The most highlighted issue is the band alignment of specific high-k structures. Band alignment relationships were deduced by analysis of XPS and UPS spectra for three different structures: a) HfO2/VO2/SiO2/Si, b) HfO 2-La2O3/ZnO/SiO2/Si, and c) HfO 2/VO2/ HfO2/SiO2/Si. The valence band offset of HfO2/VO2, ZnO/SiO2 and HfO 2/SiO2 are determined to be 3.4 +/- 0.1, 1.5 +/- 0.1, and 0.7 +/- 0.1 eV. The valence band offset between HfO2-La2O3 and ZnO was almost negligible. Two band alignment models, the electron affinity model and the charge neutrality level model, are discussed. The results show the charge neutrality model is preferred to describe these structures. 2) High-k candidate materials were studied through comparison of pure Hf oxide, pure La oxide, and alloyed Hf-La oxide films. An issue with the application of pure HfO2 is crystallization which may increase the leakage current in gate stack structures. An issue with the application of pure La2O3 is the presence of carbon contamination in the film. Our study shows that the alloyed Hf-La oxide films exhibit an amorphous structure along with reduced carbon contamination. 3) Band bending and internal electric fields in the gate stack structure were observed by XPS and UPS and indicate the charge transfer during the growth and process. The oxygen

  8. A study of the physical mechanisms responsible for heavy ion-induced latent defects in gate oxides

    International Nuclear Information System (INIS)

    Portier, M.

    2010-01-01

    Heavy ions naturally present in the radiation environment of space is a constraint to take into account for embedded electronics. It was observed that heavy ions induce nano-scale structural modifications in the oxide of the SiO 2 -Si structures. SiO 2 -Si structures were representative of the MOS devices embedded. These structural modifications induced by heavy ions can play the role of latent defects in embedded MOSFETs observed by the premature breakdown in the gate oxide of MOS power transistors during function, thus reducing their lifetime. From a statistical study of our topographic structures irradiated, we seek to highlight the parameters to take into account to better understand the physical mechanisms behind the formation of the latent defects. We would to give a full account of reality relating to the probability of formation in order to establish a full evaluation of the risks linked to these defects. It is with a better knowledge of training criteria. (author)

  9. Characterization, modeling and physical mechanisms of different surface treatment methods at room temperature on the oxide and interfacial quality of the SiO2 film using the spectroscopic scanning capacitance microscopy

    Directory of Open Access Journals (Sweden)

    Kin Mun Wong

    Full Text Available In this article, a simple, low cost and combined surface treatment method [pre-oxidation immersion of the p-type silicon (Si substrate in hydrogen peroxide (H2O2 and post oxidation ultra-violet (UV irradiation of the silicon-dioxide (SiO2 film] at room temperature is investigated. The interface trap density at midgap [Dit(mg] of the resulting SiO2 film (denoted as sample 1A is quantified from the full width at half-maximum of the scanning capacitance microscopy (SCM differential capacitance (dC/dV characteristics by utilizing a previously validated theoretical model. The Dit(mg of sample 1A is significantly lower than the sample without any surface treatments which indicates that it is a viable technique for improving the interfacial quality of the thicker SiO2 films prepared by wet oxidation. Moreover, the proposed combined surface treatment method may possibly complement the commonly used forming gas anneal process to further improve the interfacial quality of the SiO2 films. The positive shift of the flatband voltage due to the overall oxide charges (estimated from the probe tip dc bias at the peak dC/dV spectra of sample 1A suggests the presence of negative oxide fixed charge density (Nf in the oxide. In addition, an analytical formula is derived to approximate the difference of the Nf values between the oxide samples that are immersed in H2O2 and UV irradiated from their measured SCM dC/dV spectra. Conversely, some physical mechanisms are proposed that result in the ionization of the SiO− species (which are converted from the neutral SiOH groups that originate from the pre-oxidation immersion in H2O2 and ensuing wet oxidation during the UV irradiation as well as the UV photo-injected electrons from the Si substrate (which did not interact with the SiOH groups. They constitute the source of mobile electrons which partially passivate the positively charged empty donor-like interface traps at the Si-SiO2 interface. Keywords: Dielectrics

  10. Contribution to the study of metal-oxide-semiconductor devices with optical access. In2O3-SiO2-Si structure

    International Nuclear Information System (INIS)

    Thenoz, Yves.

    1974-01-01

    A general study of the fabrication of the structure In 2 O 3 /SiO 2 /Si was made encompassing the problems posed during the realization of these structures. The sputtering study enabled the influence of the main parameters on layer properties to be determined. The decisive importance of clean conditions throughout fabrication (especially during sputtering) on the properties of In 2 O 3 layers and on those of the structure and its stability was revealed. However, the problem of ageing of the structure were not investigated. Finally, the construction of MOS capacitors and transistors showed that In 2 O 3 /SiO 2 /Si structures can be used in MOS circuits [fr

  11. Metabolomic effects of CeO2, SiO2 and CuO metal oxide nanomaterials on HepG2 cells

    Science.gov (United States)

    To better assess potential hepatotoxicity of nanomaterials, human liver HepG2 cells were exposed for 3 days to five different CeO2 (either 30 or 100 μg/ml), 3 SiO2 based (30 μg/ml) or 1 CuO (3 μg/ml) nanomaterials with dry primary particle sizes ranging from 15 to 213 nm. Metabol...

  12. Statistical Design of Ultra-Thin SiO2 for Nano devices

    International Nuclear Information System (INIS)

    Hashim, U.; Abdul-Fatah, M.F.A.; Ahmad, I.; Majlis, B.Y.

    2009-01-01

    A study was performed on a series of ultra thin SiO 2 films in order to determine the factors affecting the oxide growth and also the effect of temperature to the film surface roughness. The samples of ultra thin SiO 2 were prepared through a dry oxidation method using a high temperature furnace. There are three levels of temperature used, that is 900, 950 and 1000 degree Celsius and the samples were grown at 0.333 litre/ min, 0.667 liter/ min and 1 liter/ min oxygen flow rate and different oxidation times of 1, 2 and 3 minutes. The thickness was determined using an ellipsometers and the micro morphology of the oxide surface was obtained by using an atomic force microscope (AFM). The thickness of the oxide ranged from 1 to 5 nm. All the data has been interpreted using Taguchi's method to analyze the most affecting factors in producing an ultra thin silicon dioxide. The optimum parameters are 900 degree Celsius, 0.333 litre/ min and at 1 minute time. The most influential parameter is temperature. The temperature also affects the surface roughness. The AFM result of 950 degree Celsius with RMS value of 0.1088 nm is better than the 900 degree Celsius oxide with RMS value 0.4553 nm. This shows that oxides need to be grown at a higher temperature to provide better surface roughness which is also important in ultra thin gate oxide characteristics. (author)

  13. Characterization of polycrystalline silicon-oxide-nitride-oxide-silicon devices on a SiO2 or Si3N4 buffer layer

    Science.gov (United States)

    Lee, Sang-Youl; Oh, Jae-Sub; Yang, Seung-Dong; Yun, Ho-Jin; Jeong, Kwang-Seok; Kim, Yu-Mi; Lee, Hi-Deok; Lee, Ga-Won

    2013-10-01

    Silicon-oxide-nitride-oxide-silicon (SONOS) memory devices were fabricated from polycrystalline silicon (poly-Si) using the solid phase crystallization (SPC) method for use in a low-power system-on-panel (SOP) display. In these poly-Si SONOS memories, oxide or nitride was used as a buffer layer. The electrical characteristics, such as the threshold voltage ( V T ), subthreshold slope ( SS) and transconductance ( g m ), were determined for each SONOS device. To interpret the characteristics of both poly-Si devices, x-ray diffraction (XRD) measurements and flicker noise analysis were conducted. The results show that the poly-Si SONOS on the oxide layer has better electrical, memory characteristics, such as turn-on speed and g m , program/erase, endurance and data retention than that on the nitride layer. From the XRD measurements, it is shown that the grain size of the poly-Si on the oxide layer is larger than that on the nitride layer. From the flicker noise analysis, the poly-Si device on oxide was shown to have less traps or defects in the channel layer than that on nitride.

  14. Support effect on the structure and CO oxidation activity of Cu-Cr mixed oxides over Al2O3 and SiO2

    International Nuclear Information System (INIS)

    Pantaleo, G.; Liotta, L.F.; Venezia, A.M.; Deganello, G.; Ezzo, E.M.; El Kherbawi, M.A.; Atia, H.

    2009-01-01

    Cu-Cr based catalysts supported on silica and alumina with 5 wt% total loading of (CuO + Cr 2 O 3 ), in different molar ratios, were prepared by wet impregnation. The samples were studied by nitrogen adsorption isotherms (BET), temperature-programmed reduction (TPR), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). Their catalytic activity was tested in the CO oxidation reaction. Different structures were obtained in dependence of the support, the atomic ratio and the calcination temperature. In particular, whereas on Al 2 O 3 there was no experimental evidence for interaction between Cu and Cr, over the silica supported systems formation of new phases CuCr 2 O 4 and CuCrO 2 occurred. Moreover, due to the different metal support interaction the increasing calcination temperature affected differently the surface segregation process of the two oxides. Indeed, at variance with the alumina case, Cu and Cr were found to segregate at the surface of the silica systems. The catalytic tests in CO oxidation indicated a synergetic effect between copper and chromium in the mixed oxides supported on silica and calcined at 500 deg. C. An increased calcination temperature affected negatively the activity due to surface sintering and formation of less active phases

  15. Synthesis And Characterization Of SiO2, SnO2 And TiO2 Metal Oxide Shells Covering Cu2O Particles

    Directory of Open Access Journals (Sweden)

    Yu Ri

    2015-06-01

    Full Text Available In this work is described a means of improving the chemical stability of Cu2O@SiO2, Cu2O@SnO2 and Cu2O@TiO2 materials. The SiO2, SnO2 and TiO2 coated samples were stable from pH 3 to pH 10 for up to seven days. To determine the stability of the coated nanoparticles, and their colloidal solutions under acidic and basic conditions, colloidal nanoparticle solutions with various pH values were prepared and monitored over time. Details of the effect of variations in pH on the phase stability of core-shell type Cu2O were characterized using transmission electron microscopy and X-ray diffraction.

  16. Identification of Fixed and Interface Trap Charges in Hot-Carrier Stressed Metal Oxide Semiconductor Field Effect Transistors (MOSFET's) through Ultraviolet Light Anneal and Gate Capacitance Measurements

    Science.gov (United States)

    Ling, C.

    1995-01-01

    Fixed and interface trap charges in hot-carrier degraded metal oxide semiconductor field effect transistors (MOSFET's) can be distinguished by ultraviolet light (λ=253.7 nm) annealing, and observing the resultant changes in the gate-to-drain capacitance. Trapped electrons anneal readily, resulting in large changes in the gate capacitance and the threshold voltage. This suggests a trap level below the conduction band edge of SiO2 that is smaller than the photon energy (4.9 eV). In contrast, trapped holes and interface traps do not anneal, or anneal insignificantly even after prolonged irradiation. This is consistent with a much deeper hole trap level in SiO2, generally reported.

  17. Solid-State (29)Si NMR and neutron-diffraction studies of Sr(0.7)K(0.3)SiO(2.85) oxide ion conductors.

    Science.gov (United States)

    Xu, Jungu; Wang, Xiaoming; Fu, Hui; Brown, Craig M; Jing, Xiping; Liao, Fuhui; Lu, Fengqi; Li, Xiaohui; Kuang, Xiaojun; Wu, Mingmei

    2014-07-07

    K/Na-doped SrSiO3-based oxide ion conductors were recently reported as promising candidates for low-temperature solid-oxide fuel cells. Sr0.7K0.3SiO2.85, close to the solid-solution limit of Sr1-xKxSiO3-0.5x, was characterized by solid-state (29)Si NMR spectroscopy and neutron powder diffraction (NPD). Differing with the average structure containing the vacancies stabilized within the isolated Si3O9 tetrahedral rings derived from the NPD study, the (29)Si NMR data provides new insight into the local defect structure in Sr0.7K0.3SiO2.85. The Q(1)-linked tetrahedral Si signal in the (29)Si NMR data suggests that the Si3O9 tetrahedral rings in the K-doped SrSiO3 materials were broken, forming Si3O8 chains. The Si3O8 chains can be stabilized by either bonding with the oxygen atoms of the absorbed lattice water molecules, leading to the Q(1)-linked tetrahedral Si, or sharing oxygen atoms with neighboring Si3O9 units, which is consistent with the Q(3)-linked tetrahedral Si signal detected in the (29)Si NMR spectra.

  18. Role of Oxygen in Ionic Liquid Gating on Two-Dimensional Cr2Ge2Te6: A Non-oxide Material.

    Science.gov (United States)

    Chen, Yangyang; Xing, Wenyu; Wang, Xirui; Shen, Bowen; Yuan, Wei; Su, Tang; Ma, Yang; Yao, Yunyan; Zhong, Jiangnan; Yun, Yu; Xie, X C; Jia, Shuang; Han, Wei

    2018-01-10

    Ionic liquid gating can markedly modulate a material's carrier density so as to induce metallization, superconductivity, and quantum phase transitions. One of the main issues is whether the mechanism of ionic liquid gating is an electrostatic field effect or an electrochemical effect, especially for oxide materials. Recent observation of the suppression of the ionic liquid gate-induced metallization in the presence of oxygen for oxide materials suggests the electrochemical effect. However, in more general scenarios, the role of oxygen in the ionic liquid gating effect is still unclear. Here, we perform ionic liquid gating experiments on a non-oxide material: two-dimensional ferromagnetic Cr 2 Ge 2 Te 6 . Our results demonstrate that despite the large increase of the gate leakage current in the presence of oxygen, the oxygen does not affect the ionic liquid gating effect on  the channel resistance of Cr 2 Ge 2 Te 6 devices (liquid gating is more effective on the modulation of the channel resistances compared to the back gating across the 300 nm thick SiO 2 .

  19. Molybdenum oxide supported on silica (MoO3/SiO2): an efficient and reusable catalyst for the synthesis of 1,8-dioxodecahydroacridines under solvent-free conditions

    International Nuclear Information System (INIS)

    Khojastehnezhad, A.; Vafaei, M.; Moeinpour, F.

    2014-01-01

    Silica supported molybdenum oxide (MoO 3 /SiO 2 ) was found to be and efficient, eco-friendly and heterogeneous catalyst for the multicomponent reaction of aromatic aldehydes, dimedone and ammonium acetate or aromatic amines under solvent-free conditions to afford the corresponding 1,8-dioxodecahydroacridines in high yields. The catalyst can be easily recovered and reused for several times without considerable loss of activity. Furthermore, the present method offers several advantages, such as an easy experimental and work-up procedures, short reaction times and good to excellent yields. For the characterization were used: Fourier transform infrared spectroscopy (Ft-IR), X-ray diffraction and scanning electron microscopy analyses. (Author)

  20. Application of high-quality SiO2 grown by multipolar ECR source to Si/SiGe MISFET

    Science.gov (United States)

    Sung, K. T.; Li, W. Q.; Li, S. H.; Pang, S. W.; Bhattacharya, P. K.

    1993-01-01

    A 5 nm-thick SiO2 gate was grown on an Si(p+)/Si(0.8)Ge(0.2) modulation-doped heterostructure at 26 C with an oxygen plasma generated by a multipolar electron cyclotron resonance source. The ultrathin oxide has breakdown field above 12 MV/cm and fixed charge density about 3 x 10 exp 10/sq cm. Leakage current as low as 1/micro-A was obtained with the gate biased at 4 V. The MISFET with 0.25 x 25 sq m gate shows maximum drain current of 41.6 mA/mm and peak transconductance of 21 mS/mm.

  1. Modulating the size of ZnO nanorods on SiO2 substrates by incorporating reduced graphene oxide into the seed layer solution

    Directory of Open Access Journals (Sweden)

    Tzu-Yi Yu

    2017-06-01

    Full Text Available In this research, reduced graphene oxide was incorporated into the ZnO seed layer to modulate the rod diameter of ZnO nanorods (NRs during solgel/hydrothermal growth. To characterize the reduced graphene oxide incorporated ZnO NRs, multiple material analysis techniques including field-emission scanning electron microscopy, surface contact angle measurements, X-ray diffraction, and photoluminescence were used to explore distinct properties of these size modulatable NRs. Results indicate ZnO NRs with smaller diameters could be observed with more reduced graphene oxide added into the ZnO seed layer. Furthermore, better crystallinity, higher hydrophobicity and lower defect concentration could be obtained with more amount of reduced graphene oxide added into the ZnO seed layer. The modulatable reduced graphene oxide-incorporated ZnO NRs growth is promising for future ZnO NRs based nanodevice applications.

  2. Synthesis of TiO 2-doped SiO 2 composite films and its applications

    Indian Academy of Sciences (India)

    In XRD, FT–IR, and TEM investigations of these TiO2-doped SiO2 composite films, the titanium oxide species are highly dispersed in the SiO2 matrixes and exist in a ... Anhui Key Laboratory of Functional Molecular Solids, College of Chemistry and Materials Science, Anhui Normal University, Wuhu 241000, P.R. China ...

  3. Interface Study on Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Using High-k Gate Dielectric Materials

    Directory of Open Access Journals (Sweden)

    Yu-Hsien Lin

    2015-01-01

    Full Text Available We investigated amorphous indium gallium zinc oxide (a-IGZO thin film transistors (TFTs using different high-k gate dielectric materials such as silicon nitride (Si3N4 and aluminum oxide (Al2O3 at low temperature process (<300°C and compared them with low temperature silicon dioxide (SiO2. The IGZO device with high-k gate dielectric material will expect to get high gate capacitance density to induce large amount of channel carrier and generate the higher drive current. In addition, for the integrating process of integrating IGZO device, postannealing treatment is an essential process for completing the process. The chemical reaction of the high-k/IGZO interface due to heat formation in high-k/IGZO materials results in reliability issue. We also used the voltage stress for testing the reliability for the device with different high-k gate dielectric materials and explained the interface effect by charge band diagram.

  4. A novel trench gate MOSFET with a multiple-layered gate oxide for high-reliability operation

    International Nuclear Information System (INIS)

    Kim, Sang Gi; Kah, Dong Ha; Na, Kyoung Il; Yang, Yil Suk; Koo, Jin Gun; Kim, Jong Dae; Lee, Jin Ho; Park, Hoon Soo

    2012-01-01

    Gate dielectrics in trench structures for trench gate metal oxide semiconductor field-effect transistor (MOSFET) power devices are very important to realize excellent characteristics. In this paper we describe multiple-layer gate dielectrics for trench gate MOSFETs with both thermal and chemical vapor deposition (CVD) gate oxides that exhibit excellent gate oxide properties and surface roughness. Through various trench etching experiments for better surface conditions in the trench, the optimum etching gas chemistry and etch conditions were found. The destruction of gate dielectric in trench gate MOSFET occurs at the top and the bottom trench corner edges. The structure of the gate electrode is pulled out with the polysilicon layer which is buried in the trench. Thus, high electric field operation is inevitable at the gate between source diffusion and the gate polysilicon. Moreover, the trench corner oxide suffers from the high electric field. We propose a multiple-gate dielectric structure of a thermal oxide and CVD oxide for highly reliable operation of the device. This enables trench surface smoothing and low thermal stress at the trench corners and provides the oxide thickness uniformity, giving superior device characteristics of high breakdown voltage and low leakage current. These improvements are caused by the excellent quality of the gate oxide and the good thickness uniformity that is formed at the inner trench with a specific geometrical factor.

  5. Fabrication of Coatings on the Surface of Magnesium Alloy by Plasma Electrolytic Oxidation Using ZrO2 and SiO2 Nanoparticles

    Directory of Open Access Journals (Sweden)

    S. V. Gnedenkov

    2015-01-01

    Full Text Available Results of investigation of the incorporation of zirconia and silica nanoparticles into the coatings formed on magnesium alloy by plasma electrolytic oxidation are presented. Comprehensive research of electrochemical and mechanical properties of obtained coatings was carried out. It was established that the polarization resistance of the samples with a coating containing zirconia nanoparticles is two times higher than that for the sample with base PEO layer. One of the important reasons for improving the protective properties of coatings formed in electrolytes containing nanoparticles consists in enhanced morphological characteristics, in particular, the porosity decrease and increase of thickness and resistivity (up to two orders of magnitude for ZrO2-containing coating of porousless sublayer in comparison with base PEO layer. Incorporation of silica and zirconia particles into the coating increases the mechanical performances. The layers containing nanoparticles have greater hardness and are more wear resistant in comparison with the coatings formed in the base electrolyte.

  6. Localization and characterization of ultra thin gate oxide breakdown regions

    NARCIS (Netherlands)

    Akil, N.A.; Le Minh, P.; Holleman, J.; Houtsma, V.E.; Woerlee, P.H.

    2000-01-01

    Nano-scale diodes were formed after intentional gate oxide breakdown of n+ –olysilicon/oxide/p+ –ubstrate MOS capacitors by Fowler-Nordheim constant current injection. The nano-scale diodes called diode-antifuses are created by the formation of a small link through the oxide between the n+ –oly and

  7. Flexible Proton-Gated Oxide Synaptic Transistors on Si Membrane.

    Science.gov (United States)

    Zhu, Li Qiang; Wan, Chang Jin; Gao, Ping Qi; Liu, Yang Hui; Xiao, Hui; Ye, Ji Chun; Wan, Qing

    2016-08-24

    Ion-conducting materials have received considerable attention for their applications in fuel cells, electrochemical devices, and sensors. Here, flexible indium zinc oxide (InZnO) synaptic transistors with multiple presynaptic inputs gated by proton-conducting phosphorosilicate glass-based electrolyte films are fabricated on ultrathin Si membranes. Transient characteristics of the proton gated InZnO synaptic transistors are investigated, indicating stable proton-gating behaviors. Short-term synaptic plasticities are mimicked on the proposed proton-gated synaptic transistors. Furthermore, synaptic integration regulations are mimicked on the proposed synaptic transistor networks. Spiking logic modulations are realized based on the transition between superlinear and sublinear synaptic integration. The multigates coupled flexible proton-gated oxide synaptic transistors may be interesting for neuroinspired platforms with sophisticated spatiotemporal information processing.

  8. Slow response in gate current-voltage characteristics of metal-oxide-semiconductor structures on the 4H-SiC(000\\bar{1}) face

    Science.gov (United States)

    Kumagai, Naoki; Kimura, Hiroshi; Onishi, Yasuhiko; Okamoto, Mitsuo; Fukuda, Kenji

    2016-05-01

    We have investigated the gate current-voltage (I g-V g) characteristics of n-channel metal-oxide-semiconductor field-effect transistors (MOSFETs) and p-MOS capacitors on the 4H-SiC(000\\bar{1}) face. The gate current response to a change in gate voltage has a very slow part, which has been considered to be due to slow traps in the oxide near the SiO2-SiC interface. However, we found that the slow response can be explained by fast interface traps if the traps have a relatively large concentration. Carrier injection into the interface traps results in a change in the surface potential, and this suppresses the further injection of carriers. This new model can explain many electrical properties such as the constant-current behavior in the I g-V g characteristics, which was confirmed by one-dimensional (1D) device simulation. According to this model, the interface traps will not be occupied up to the surface Fermi level within the general time scale of the measurement. In spite of the arguments described above, slow traps also probably exist near the interface between SiO2 and SiC.

  9. A simple chemical view of relaxations at stoichiometric (1 1 0) surfaces of rutile-structure type oxides: A first-principles study of stishovite, SiO 2

    Science.gov (United States)

    Muscenti, Thomas M.; Gibbs, G. V.; Cox, David F.

    2005-12-01

    First-principles electronic structure calculations have been used to examine the geometric and electronic structure of the bulk and (1 1 0) surface of stishovite, the rutile-structure polymorph of SiO 2. The primary changes in geometric and electronic structure associated with surface relaxation are similar to those predicted for stoichiometric (1 1 0) surfaces of other rutile-structure oxides: TiO 2, SnO 2, RuO 2. Occupied surface states can be attributed primarily to changes in the local coordination environment (hybridization) of surface oxygen anions, and the relaxations that lead to "rumpling" of the stoichiometric (1 1 0) surface can be viewed as a change in hybridization of 3-coordinated in-plane oxygen from a planar (sp 2) bulk local coordination environment to a lower-energy, non-planar, pyramidal (sp 3) surface geometry, following earlier descriptions by Godin and LaFemina for SnO 2(1 1 0). It is demonstrated that these descriptions follow naturally from a visual examination of the 3D valence charge density distributions and the electron localization function (ELF) which provide a view of the electronic structure in terms of electron bond pairs and lone pairs. Consideration of the surface relaxations in terms of molecular analogs suggests that the simple valence shell electron pair repulsion (VSEPR) model provides insight into the chemical driving force for surface relaxation and oxygen rehybridization.

  10. Determination of trace/ultratrace rare earth elements in environmental samples by ICP-MS after magnetic solid phase extraction with Fe3O4@SiO2@polyaniline-graphene oxide composite.

    Science.gov (United States)

    Su, Shaowei; Chen, Beibei; He, Man; Hu, Bin; Xiao, Zuowei

    2014-02-01

    A novel Fe3O4@SiO2@polyaniline-graphene oxide composite (MPANI-GO) was prepared through a simple noncovalent method and applied to magnetic solid phase extraction (MSPE) of trace rare earth elements (REEs) in tea leaves and environmental water samples followed by inductively coupled plasma mass spectrometry (ICP-MS) detection. The prepared MPANI-GO was characterized by transmission electron microscopy and vibrating sample magnetometer. Various parameters affecting MPANI-GO MSPE of REEs have been investigated. Under the optimized conditions, the limits of detection (LODs, 3σ) for REEs were in the range of 0.04-1.49 ng L(-1) and the relative standard deviations (RSDs, c=20 ng L(-1), n=7) were 1.7-6.5%. The accuracy of the proposed method was validated by analyzing a Certified Reference Material of GBW 07605 tea leaves. The method was also successfully applied for the determination of trace REEs in tea leaves and environmental water samples. The developed MPANI-GO MSPE-ICP-MS method has the advantages of simplicity, rapidity, high sensitivity, high enrichment factor and is suitable for the analysis of trace REEs in samples with complex matrix. © 2013 Elsevier B.V. All rights reserved.

  11. Controlled fabrication of Si nanocrystal delta-layers in thin SiO2 layers by plasma immersion ion implantation for nonvolatile memories

    International Nuclear Information System (INIS)

    Bonafos, C.; Ben-Assayag, G.; Groenen, J.; Carrada, M.; Spiegel, Y.; Torregrosa, F.; Normand, P.; Dimitrakis, P.; Kapetanakis, E.; Sahu, B. S.; Slaoui, A.

    2013-01-01

    Plasma Immersion Ion Implantation (PIII) is a promising alternative to beam line implantation to produce a single layer of nanocrystals (NCs) in the gate insulator of metal-oxide semiconductor devices. We report herein the fabrication of two-dimensional Si-NCs arrays in thin SiO 2 films using PIII and rapid thermal annealing. The effect of plasma and implantation conditions on the structural properties of the NC layers is examined by transmission electron microscopy. A fine tuning of the NCs characteristics is possible by optimizing the oxide thickness, implantation energy, and dose. Electrical characterization revealed that the PIII-produced-Si NC structures are appealing for nonvolatile memories

  12. A novel approach for the synthesis of ultrathin silica-coated iron oxide nanocubes decorated with silver nanodots (Fe3O4/SiO2/Ag) and their superior catalytic reduction of 4-nitroaniline

    Science.gov (United States)

    Abbas, Mohamed; Torati, Sri Ramulu; Kim, Cheolgi

    2015-07-01

    A novel sonochemical approach was developed for the synthesis of different core/shell structures of Fe3O4/SiO2/Ag nanocubes and SiO2/Ag nanospheres. The total reaction time of the three sonochemical steps for the synthesis of Fe3O4/SiO2/Ag nanocubes is shorter than that of the previously reported methods. A proposed reaction mechanism for the sonochemical functionalization of the silica and the silver on the surface of magnetic nanocubes was discussed in detail. Transmission electron microscopy revealed that the surface of Fe3O4/SiO2 nanocubes was decorated with small Ag nanoparticles of approximately 10-20 nm in size, and the energy dispersive spectroscopy mapping analysis confirmed the morphology of the structure. Additionally, X-ray diffraction data were used to confirm the formation of both phases of a cubic inverse spinel structure for Fe3O4 and bcc structures for Ag in the core/shell structure of the Fe3O4/SiO2/Ag nanocubes. The as-synthesized Fe3O4/SiO2/Ag nanocubes showed a high efficiency in the catalytic reduction reaction of 4-nitroaniline to 4-phenylenediamine and a better performance than both Ag and SiO2/Ag nanoparticles. The grafted silver catalyst was recycled and reused at least fifteen times without a significant loss of catalytic efficiency.A novel sonochemical approach was developed for the synthesis of different core/shell structures of Fe3O4/SiO2/Ag nanocubes and SiO2/Ag nanospheres. The total reaction time of the three sonochemical steps for the synthesis of Fe3O4/SiO2/Ag nanocubes is shorter than that of the previously reported methods. A proposed reaction mechanism for the sonochemical functionalization of the silica and the silver on the surface of magnetic nanocubes was discussed in detail. Transmission electron microscopy revealed that the surface of Fe3O4/SiO2 nanocubes was decorated with small Ag nanoparticles of approximately 10-20 nm in size, and the energy dispersive spectroscopy mapping analysis confirmed the morphology of the structure. Additionally, X-ray diffraction data were used to confirm the formation of both phases of a cubic inverse spinel structure for Fe3O4 and bcc structures for Ag in the core/shell structure of the Fe3O4/SiO2/Ag nanocubes. The as-synthesized Fe3O4/SiO2/Ag nanocubes showed a high efficiency in the catalytic reduction reaction of 4-nitroaniline to 4-phenylenediamine and a better performance than both Ag and SiO2/Ag nanoparticles. The grafted silver catalyst was recycled and reused at least fifteen times without a significant loss of catalytic efficiency. Electronic supplementary information (ESI) available. See DOI: 10.1039/c5nr02680f

  13. Study of the electronic structure modifications of silicon oxide (α -SiO2), aluminium oxide (α -Al2O3) and yttrium oxide (Y2O3), induced by structure defects (non-stoichiometry, mechanical stresses, heavy ion irradiation)

    International Nuclear Information System (INIS)

    Jollet, F.

    1990-01-01

    We have studied ceramics, experimentally (X-ray threshold absorption, photoelectron spectroscopy) and theoretically (density of states calculations based on a tight-binding method). Three ways have been followed: - influence of oxygen stoichiometry on the electronic structure of Y 2 O 3 : we have showed the splitting of the yttrium d-orbitals (octahedral symetry site), the splitting of the K-yttrium threshold (band effect), and the splitting of the K-oxygen threshold (hybridization of the oxygen p-levels with the yttrium p and d levels in the conduction band). For the valence band, the importance of O-O interactions have been underlined. The introduction of oxygen vacancies makes the Y-O bond more covalent, so that samples are more conductive and their optical dielectric constant increases. - effect of a mechanical stress on the electronic structure of quartz (α -SiO 2 ): - influence of a heavy ion irradiation on the electronic structure of quartz and alumina: After irradiation, quartz is in a desorganized crystalline state, different from an amorphous state. Results have been interpreted in terms of metamict state and internal mechanical stresses [fr

  14. Kinetics of Valeric Acid Ketonization and Ketenization in Catalytic Pyrolysis on Nanosized SiO2, γ-Al2O3, CeO2/SiO2, Al2O3/SiO2and TiO2/SiO2.

    Science.gov (United States)

    Kulyk, Kostiantyn; Palianytsia, Borys; Alexander, John D; Azizova, Liana; Borysenko, Mykola; Kartel, Mykola; Larsson, Mats; Kulik, Tetiana

    2017-07-19

    Valeric acid is an important renewable platform chemical that can be produced efficiently from lignocellulosic biomass. Upgrading of valeric acid by catalytic pyrolysis has the potential to produce value added biofuels and chemicals on an industrial scale. Understanding the different mechanisms involved in the thermal transformations of valeric acid on the surface of nanometer-sized oxides is important for the development of efficient heterogeneously catalyzed pyrolytic conversion techniques. In this work, the thermal decomposition of valeric acid on the surface of nanoscale SiO 2 , γ-Al 2 O 3 , CeO 2 /SiO 2 , Al 2 O 3 /SiO 2 and TiO 2 /SiO 2 has been investigated by temperature-programmed desorption mass spectrometry (TPD MS). Fourier transform infrared spectroscopy (FTIR) has also been used to investigate the structure of valeric acid complexes on the oxide surfaces. Two main products of pyrolytic conversion were observed to be formed depending on the nano-catalyst used-dibutylketone and propylketene. Mechanisms of ketene and ketone formation from chemisorbed fragments of valeric acid are proposed and the kinetic parameters of the corresponding reactions were calculated. It was found that the activation energy of ketenization decreases in the order SiO 2 >γ-Al 2 O 3 >TiO 2 /SiO 2 >Al 2 O 3 /SiO 2 , and the activation energy of ketonization decreases in the order γ-Al 2 O 3 >CeO 2 /SiO 2 . Nano-oxide CeO 2 /SiO 2 was found to selectively catalyze the ketonization reaction. © 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

  15. Development and characterization of glass-ceramic sealants in the (CaO-Al2O3-SiO2-B2O3) system for Solid Oxide Electrolyzer Cells

    International Nuclear Information System (INIS)

    Khedim, Hichem; Nonnet, Helene; Mear, Francois O.

    2012-01-01

    The efficiency of glass-ceramic sealants plays a crucial role in Solid Oxide Electrolyzer Cell performance and durability. In order to develop suitable sealants, operating around 800 degrees C, two parent glass compositions, CAS1B and CAS2B, from the CaO-Al 2 O 3 -SiO 2 -B 2 O 3 system were prepared and explored. The thermal and physicochemical properties of the glass ceramics and their crystallization behavior were investigated by HSM. DTA and XRD analyses. The microstructure and chemical compositions of the crystalline phases were investigated by microprobe analysis. Bonding characteristic as well as chemical interactions of the parent glass with yttria-stabilized zirconia (YSZ) electrolyte and ferritic steel-based interconnect (Crofere (R)) were also investigated. The preliminary results revealed the superiority of CAS2B glass for sealing application in SOECs. The effect of minor additions of V 2 O 5 , K 2 O and TiO 2 on the thermal properties was also studied and again demonstrated the advantages of the CAS2B glass composition. Examining the influence of heat treatment on the seal behavior showed that the choice of the heating rate is a compromise between delaying the crystallization process and delaying the viscosity drop. The thermal Expansion Coefficients (TEC) obtained for the selected glass ceramic are within the desired range after the heat treatment of crystallization. The crystallization kinetic parameters of the selected glass composition were also determined under non-isothermal conditions by means of differential thermal analysis (DTA) and using the formal theory of transformations for heterogeneous nucleation. (authors)

  16. Development and characterization of glass-ceramic sealants in the (CaO-Al2O3-SiO2-B2O3) system for Solid Oxide Electrolyzer Cells

    Science.gov (United States)

    Khedim, Hichem; Nonnet, Hélène; Méar, François O.

    2012-10-01

    The efficiency of glass-ceramic sealants plays a crucial role in Solid Oxide Electrolyzer Cell performance and durability. In order to develop suitable sealants, operating around 800 °C, two parent glass compositions, CAS1B and CAS2B, from the CaO-Al2O3-SiO2-B2O3 system were prepared and explored. The thermal and physicochemical properties of the glass ceramics and their crystallization behavior were investigated by HSM, DTA and XRD analyses. The microstructure and chemical compositions of the crystalline phases were investigated by microprobe analysis. Bonding characteristic as well as chemical interactions of the parent glass with yttria-stabilized zirconia (YSZ) electrolyte and ferritic steel-based interconnect (Crofer®) were also investigated. The preliminary results revealed the superiority of CAS2B glass for sealing application in SOECs. The effect of minor additions of V2O5, K2O and TiO2 on the thermal properties was also studied and again demonstrated the advantages of the CAS2B glass composition. Examining the influence of heat treatment on the seal behavior showed that the choice of the heating rate is a compromise between delaying the crystallization process and delaying the viscosity drop. The thermal Expansion Coefficients (TEC) obtained for the selected glass ceramic are within the desired range after the heat treatment of crystallization. The crystallization kinetic parameters of the selected glass composition were also determined under non-isothermal conditions by means of differential thermal analysis (DTA) and using the formal theory of transformations for heterogeneous nucleation.

  17. Cleaning Challenges of High-κ/Metal Gate Structures

    KAUST Repository

    Hussain, Muhammad Mustafa

    2010-12-20

    High-κ/metal gates are used as transistors for advanced logic applications to improve speed and eliminate electrical issues associated with polySi and SiO2 gates. Various integration schemes are possible and will be discussed, such as dual gate, gate-first, and gate-last, both of which require specialized cleaning and etching steps. Specific areas of discussion will include cleaning and conditioning of the silicon surface, forming a high-quality chemical oxide, removal of the high-κ dielectric with selectivity to the SiO2 layer, cleaning and residue removal after etching, and prevention of galvanic corrosion during cleaning. © 2011 Scrivener Publishing LLC. All rights reserved.

  18. Atomic layer-deposited Al–HfO2/SiO2 bi-layers towards 3D charge trapping non-volatile memory

    International Nuclear Information System (INIS)

    Congedo, Gabriele; Wiemer, Claudia; Lamperti, Alessio; Cianci, Elena; Molle, Alessandro; Volpe, Flavio G.; Spiga, Sabina

    2013-01-01

    A metal/oxide/high-κ dielectric/oxide/silicon (MOHOS) planar charge trapping memory capacitor including SiO 2 as tunnel oxide, Al–HfO 2 as charge trapping layer, SiO 2 as blocking oxide and TaN metal gate was fabricated and characterized as test vehicle in the view of integration into 3D cells. The thin charge trapping layer and blocking oxide were grown by atomic layer deposition, the technique of choice for the implementation of these stacks into 3D structures. The oxide stack shows a good thermal stability for annealing temperature of 900 °C in N 2 , as required for standard complementary metal–oxide–semiconductor processes. MOHOS capacitors can be efficiently programmed and erased under the applied voltages of ± 20 V to ± 12 V. When compared to a benchmark structure including thin Si 3 N 4 as charge trapping layer, the MOHOS cell shows comparable program characteristics, with the further advantage of the equivalent oxide thickness scalability due to the high dielectric constant (κ) value of 32, and an excellent retention even for strong testing conditions. Our results proved that high-κ based oxide structures grown by atomic layer deposition can be of interest for the integration into three dimensionally stacked charge trapping devices. - Highlights: ► Charge trapping device with Al–HfO 2 storage layer is fabricated and characterized. ► Al–HfO 2 and SiO 2 blocking oxides are deposited by atomic layer deposition. ► The oxide stack shows a good thermal stability after annealing at 900 °C. ► The device can be efficiently programmed/erased and retention is excellent. ► The oxide stack could be used for 3D-stacked Flash non-volatile memories

  19. Interface state density of SiO2/p-type 4H-SiC ( 0001 ), ( 11 2 ¯ 0 ), ( 1 1 ¯ 00 ) metal-oxide-semiconductor structures characterized by low-temperature subthreshold slopes

    Science.gov (United States)

    Kobayashi, Takuma; Nakazawa, Seiya; Okuda, Takafumi; Suda, Jun; Kimoto, Tsunenobu

    2016-04-01

    Interface properties of heavily Al-doped 4H-SiC ( 0001 ) (Si-face), ( 11 2 ¯ 0 ) (a-face), and ( 1 1 ¯ 00 ) (m-face) metal-oxide-semiconductor (MOS) structures were characterized from the low-temperature gate characteristics of metal-oxide-semiconductor field-effect transistors (MOSFETs). From low-temperature subthreshold slopes, interface state density (Dit) at very shallow energy levels (ET) near the conduction band edge (Ec) was evaluated. We discovered that the Dit near Ec (Ec - 0.01 eV MOS structures with higher Al doping density for every crystal face (Si-, a-, and m-face). Linear correlation is observed between the channel mobility and Dit near Ec, and we concluded that the mobility drop observed in heavily doped MOSFETs is mainly caused by the increase of Dit near Ec.

  20. Impact of oxide thickness on gate capacitance – Modelling and ...

    Indian Academy of Sciences (India)

    approaches the nanometer regime, the oxide capacitance Cox becomes comparable to the inversion layer capacitance Cinv which means that the quantum capacitance CQ and the centroid capacitance Ccent start to affect the gate capacitance [8]. The centroid capacitance. Ccent is related to the average physical distance ...

  1. Synthesis of double oxides TiO2-SiO2 with low titanium content by hydrolysis of tetrabutoxytitanium-tetraethoxysilane mixture in an atmosphere of water vapor and ammonia

    OpenAIRE

    Shishmakov, A. B.; Koryakova, O. V.; Seleznev, A. S.; Petrov, L. A.; Melkozerov, S. A.

    2013-01-01

    A series of TiO2-SiO2 binary xerogels with the titanium content lower than 7 mol % were prepared by joint hydrolysis of tetrabutoxytitanium and tetraethoxysilane in a desiccator in the atmosphere of vapor over 5% aqueous NH3 solution under static conditions. The physicochemical properties of the material were examined by IR spectroscopy and by the kinetic method with hydrogen peroxide decomposition as model reaction. © 2013 Pleiades Publishing, Ltd.

  2. Channel mobility degradation and charge trapping in high-k/metal gate NMOSFETs

    International Nuclear Information System (INIS)

    Mathew, Shajan; Bera, L.K.; Balasubramanian, N.; Joo, M.S.; Cho, B.J.

    2004-01-01

    NMOSFETs with Metalo-Organic Chemical Vapor Deposited (MOCVD) HfAlO gate dielectric and TiN metal gate have been fabricated. Channel electron mobility was measured using the split-CV method and compared with SiO 2 devices. All high-k devices showed lower mobility compared with SiO 2 reference devices. High-k MOSFETs exhibited significant charge trapping and threshold instability. Threshold voltage recovery with time was studied on devices with oxide/nitride interfacial layer between high-k film and silicon substrate

  3. Study of electronic structure modifications of silicon oxides (alpha SiO2), aluminium oxide (alpha Al2O3) and yttrium oxide (Y2O3) induced by structure defects (non stoichiometry, stresses, high energy ion irradiation)

    International Nuclear Information System (INIS)

    Jollet, F.

    1989-10-01

    Influence of structure defects on electronic structure of ceramics is studied by X-ray absorption spectroscopy, photoelectron spectroscopy and state density calculations with the tight-binding model. Are investigated: Influence of oxygen stoichiometry on electronic structure of yttrium oxide, effect of mechanical stress on electronic structure of quartz alpha and effect of irradiation by high energy ions on electronic structure of quartz. Irradiated quartz show a disorganized crystalline state which is different from amorphous state. Results are interpreted as metamicte state internal stresses [fr

  4. SiO2/polyacrylonitrile membranes via centrifugal spinning as a separator for Li-ion batteries

    Science.gov (United States)

    Yanilmaz, Meltem; Lu, Yao; Li, Ying; Zhang, Xiangwu

    2015-01-01

    Centrifugal spinning is a fast, cost-effective and safe alternative to the electrospinning technique, which is commonly used for making fiber-based separator membranes. In this work, SiO2/polyacrylonitrile (PAN) membranes were produced by using centrifugal spinning and they were characterized by using different electrochemical techniques for use as separators in Li-ion batteries. SiO2/PAN membranes exhibited good wettability and high ionic conductivity due to their highly porous fibrous structure. Compared with commercial microporous polyolefin membranes, SiO2/PAN membranes had larger liquid electrolyte uptake, higher electrochemical oxidation limit, and lower interfacial resistance with lithium. SiO2/PAN membrane separators were assembled into lithium/lithium iron phosphate cells and these cells delivered high capacities and exhibited good cycling performance at room temperature. In addition, cells using SiO2/PAN membranes showed superior C-rate performance compared to those using microporous PP membrane.

  5. Coulombic and neutral electron trapping centers in SiO 2

    Science.gov (United States)

    Buchanan, D. A.; Fischetti, M. V.; Dimaria, D. J.

    1989-10-01

    Metal-oxide-semiconductor (MOS) structures incorporating thermally grown silicon dioxide (SiO 2) films were implanted with arsenic ions (As +) and then annealed at high temperatures. Coulombic-attractive traps (for electrons) were produced with the avalanche injection of holes from the silicon substrate and their subsequent capture on some of these arsenic-related sites. During internal photo-emission of electrons from a thin aluminum gate, the voltage shifts due to hole annihilation by electrons were recorded and the macroscopic capture cross-section, σ, was determined. We found that σ varies from ˜10 -12 to 3 × 10 -15 cm 2 for average electric fields ranging from 2 × 10 5 to 3 × 10 6 V/cm. Below an average field threshold of Fth ≈ 1.2 × 10 6 V/cm, the capture cross-section versus average field (σ versus Fave) dependence follows a power law with the exponent n ≈ -1.5. Above the average field threshold, the power law exponent was found to be n ≈ -3.0. Also when the amphoteric arsenic-related sites are empty, they form neutral trapping sites for electrons. For average fields ranging from 5 × 10 5 to 6 × 10 6 V/cm, the neutral cross-section is found to be approximately constant at σ ≈ (1-2) × 10 -15 cm 2.

  6. Thermodynamics of Bi2O3-SiO2 system

    Directory of Open Access Journals (Sweden)

    Onderka B.

    2017-01-01

    Full Text Available Thermodynamic properties of the liquid Bi2O3-SiO2 solutions were determined from the results of the electrochemical measurements by use of the solid oxide galvanic cells with YSZ (Yttria-Stabilized-Zirconia electrolyte. Activities of Bi2O3 in the solutions were determined for 0.2, 0.3, 0.4, and 0.5 SiO2 mole fractions in the temperature range 1073-1293 K from measured electromotive force (e.m.f of the solid electrolyte galvanic cell: Bi, Bi2O3-SiO2 | YSZ | air (pO2 = 0.213 bar Additionally, heat capacity data obtained for two solid phases 6Bi2O3•SiO2 and 2Bi2O3•3SiO2 were included into optimization of thermodynamic properties of the system. Optimization procedure was supported by differential thermal analysis (DTA data obtained in this work as well as those accepted from the literature. Using the data obtained in this work, and the information about phase equilibria found in the literature, binary system Bi2O3-SiO2 was assessed with the ThermoCalc software.

  7. Catalytic combustion of trichloroethylene over TiO2-SiO2 supported catalysts

    NARCIS (Netherlands)

    Kulazynski, M.; van Ommen, J.G.; Trawczynski, J.; Walendziewski, J.

    2002-01-01

    Combustion of trichloroethylene (TCE) on Cr2O3, V2O5, Pt or Pd catalysts supported on TiO2-SiO2 as a carrier has been investigated. It was found that oxide catalysts are very active but their activity quickly diminishes due to loss of the active component, especially at higher reaction temperatures

  8. Selective SiO2 etching in three dimensional structures using parylene-C as mask

    NARCIS (Netherlands)

    Veltkamp, Henk-Willem; Zhao, Yiyuan; de Boer, Meint J.; Wiegerink, Remco J.; Lötters, Joost Conrad

    2017-01-01

    This abstract describes an application of an easy and straightforward method for selective SiO2 etching in three dimensional structures, which is developed by our group. The application in this abstract is the protection of the buried-oxide (BOX) layer of a silicon-on-insulator (SOI) wafer against

  9. Synthesis of TiO2-doped SiO2 composite films and its applications

    Indian Academy of Sciences (India)

    Wintec

    And special attention has been focused on the relationship between the local structure of the titanium oxide species in the TiO2-doped SiO2 composite films and the photocatalytic reactiv- ity in order to provide vital information for the design and application of such highly efficient photocatalytic systems in the degradation of ...

  10. Preparation and Characterization of ZnO Nanoparticles Supported on Amorphous SiO2

    Directory of Open Access Journals (Sweden)

    Ying Chen

    2017-08-01

    Full Text Available In order to reduce the primary particle size of zinc oxide (ZnO and eliminate the agglomeration phenomenon to form a monodisperse state, Zn2+ was loaded on the surface of amorphous silica (SiO2 by the hydrogen bond association between hydroxyl groups in the hydrothermal process. After calcining the precursors, dehydration condensation among hydroxyl groups occurred and ZnO nanoparticles supported on amorphous SiO2 (ZnO–SiO2 were prepared. Furthermore, the SEM and TEM observations showed that ZnO nanoparticles with a particle size of 3–8 nm were uniformly and dispersedly loaded on the surface of amorphous SiO2. Compared with pure ZnO, ZnO–SiO2 showed a much better antibacterial performance in the minimum inhibitory concentration (MIC test and the antibacterial properties of the paint adding ZnO–SiO2 composite.

  11. Study of strained-Si p-channel MOSFETs with HfO2 gate dielectric

    Science.gov (United States)

    Pradhan, Diana; Das, Sanghamitra; Dash, Tara Prasanna

    2016-10-01

    In this work, the transconductance of strained-Si p-MOSFETs with high-K dielectric (HfO2) as gate oxide, has been presented through simulation using the TCAD tool Silvaco-ATLAS. The results have been compared with a SiO2/strained-Si p-MOSFET device. Peak transconductance enhancement factors of 2.97 and 2.73 has been obtained for strained-Si p-MOSFETs in comparison to bulk Si channel p-MOSFETs with SiO2 and high-K dielectric respectively. This behavior is in good agreement with the reported experimental results. The transconductance of the strained-Si device at low temperatures has also been simulated. As expected, the mobility and hence the transconductance increases at lower temperatures due to reduced phonon scattering. However, the enhancements with high-K gate dielectric is less as compared to that with SiO2.

  12. Graphene-graphene oxide floating gate transistor memory.

    Science.gov (United States)

    Jang, Sukjae; Hwang, Euyheon; Lee, Jung Heon; Park, Ho Seok; Cho, Jeong Ho

    2015-01-21

    A novel transparent, flexible, graphene channel floating-gate transistor memory (FGTM) device is fabricated using a graphene oxide (GO) charge trapping layer on a plastic substrate. The GO layer, which bears ammonium groups (NH3+), is prepared at the interface between the crosslinked PVP (cPVP) tunneling dielectric and the Al2 O3 blocking dielectric layers. Important design rules are proposed for a high-performance graphene memory device: (i) precise doping of the graphene channel, and (ii) chemical functionalization of the GO charge trapping layer. How to control memory characteristics by graphene doping is systematically explained, and the optimal conditions for the best performance of the memory devices are found. Note that precise control over the doping of the graphene channel maximizes the conductance difference at a zero gate voltage, which reduces the device power consumption. The proposed optimization via graphene doping can be applied to any graphene channel transistor-type memory device. Additionally, the positively charged GO (GO-NH3+) interacts electrostatically with hydroxyl groups of both UV-treated Al2 O3 and PVP layers, which enhances the interfacial adhesion, and thus the mechanical stability of the device during bending. The resulting graphene-graphene oxide FGTMs exhibit excellent memory characteristics, including a large memory window (11.7 V), fast switching speed (1 μs), cyclic endurance (200 cycles), stable retention (10(5) s), and good mechanical stability (1000 cycles). © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  13. Study of the tunnelling initiated leakage current through the carbon nanotube embedded gate oxide in metal oxide semiconductor structures

    International Nuclear Information System (INIS)

    Chakraborty, Gargi; Sarkar, C K; Lu, X B; Dai, J Y

    2008-01-01

    The tunnelling currents through the gate dielectric partly embedded with semiconducting single-wall carbon nanotubes in a silicon metal-oxide-semiconductor (MOS) structure have been investigated. The application of the gate voltage to such an MOS device results in the band bending at the interface of the partly embedded oxide dielectric and the surface of the silicon, initiating tunnelling through the gate oxide responsible for the gate leakage current whenever the thickness of the oxide is scaled. A model for silicon MOS structures, where carbon nanotubes are confined in a narrow layer embedded in the gate dielectric, is proposed to investigate the direct and the Fowler-Nordheim (FN) tunnelling currents of such systems. The idea of embedding such elements in the gate oxide is to assess the possibility for charge storage for memory device applications. Comparing the FN tunnelling onset voltage between the pure gate oxide and the gate oxide embedded with carbon nanotubes, it is found that the onset voltage decreases with the introduction of the nanotubes. The direct tunnelling current has also been studied at very low gate bias, for the thin oxide MOS structure which plays an important role in scaling down the MOS transistors. The FN tunnelling current has also been studied with varying nanotube diameter

  14. Study of the tunnelling initiated leakage current through the carbon nanotube embedded gate oxide in metal oxide semiconductor structures.

    Science.gov (United States)

    Chakraborty, Gargi; Sarkar, C K; Lu, X B; Dai, J Y

    2008-06-25

    The tunnelling currents through the gate dielectric partly embedded with semiconducting single-wall carbon nanotubes in a silicon metal-oxide-semiconductor (MOS) structure have been investigated. The application of the gate voltage to such an MOS device results in the band bending at the interface of the partly embedded oxide dielectric and the surface of the silicon, initiating tunnelling through the gate oxide responsible for the gate leakage current whenever the thickness of the oxide is scaled. A model for silicon MOS structures, where carbon nanotubes are confined in a narrow layer embedded in the gate dielectric, is proposed to investigate the direct and the Fowler-Nordheim (FN) tunnelling currents of such systems. The idea of embedding such elements in the gate oxide is to assess the possibility for charge storage for memory device applications. Comparing the FN tunnelling onset voltage between the pure gate oxide and the gate oxide embedded with carbon nanotubes, it is found that the onset voltage decreases with the introduction of the nanotubes. The direct tunnelling current has also been studied at very low gate bias, for the thin oxide MOS structure which plays an important role in scaling down the MOS transistors. The FN tunnelling current has also been studied with varying nanotube diameter.

  15. Tailoring the nickel nanoparticles anchored on the surface of Fe3O4@SiO2 spheres for nanocatalysis

    Science.gov (United States)

    Ding, Lei; Zhang, Min; Zhang, Yanwei; Yang, Jinbo; Zheng, Jing; Hayat, Tasawar; Alharbi, Njud S.; Xu, Jingli

    2017-08-01

    Herein, we report an efficient and universal strategy for synthesizing a unique triple-shell structured Fe3O4@SiO2@C-Ni hybrid composite. Firstly, the Fe3O4 cores were synthesized by hydrothermal reaction, and sequentially coated with SiO2 and a thin layer of nickel-ion-doped resin-formaldehyde (RF-Ni2+) using an extended Stöber method. This was followed by carbonization to produce the Fe3O4@SiO2@C-Ni nanocomposites with metallic nickel nanoparticles embedded in an RF-derived thin graphic carbon layer. Interestingly, the thin SiO2 spacer layer between RF-Ni2+ and Fe3O4 plays a critical role on adjusting the size and density of the nickel nanoparticles on the surface of Fe3O4@SiO2 nanospheres. The detailed tailoring mechanism is explicitly discussed, and it is shown that the iron oxide core can react with the nickel nanoparticles without the SiO2 spacer layer, and the size and density of the nickel nanoparticles can be effectively controlled when the SiO2 layer exits. The multifunctional composites exhibit a significantly enhanced catalytic performance in the reduction of 4-nitrophenol (4-NP).

  16. Effect of alkali earth oxides on hydroxy-carbonated apatite nano layer formation for SiO2-BaO-CaO-Na2O-P2O5 glass system

    Science.gov (United States)

    Kiran, P.; Ramakrishna, V.; Shashikala, H. D.; Udayashankar, N. K.

    2017-11-01

    Barium soda lime phosphosilicate [(58SiO2-(32 - x)BaO- xCao-6Na2O-4P2O5 (where x = 15, 20, 25 and 30 mol%)] samples were synthesised using conventional sol-gel method at 700 °C sintering temperature. Thermal, structural properties were studied using thermo gravimetric analysis and differential thermal analysis, X-ray diffraction, scanning electron microscopy, fourier transform infrared and Raman spectroscopy. Using Raman spectra non-bridging oxygen concentrations were estimated. The hydroxy-carbonated apatite (HCA) layer formation on samples was analysed for 7 days using simulated body fluid (SBF) soaked samples. The growth of HCA layers self-assembled on the sample surface was discussed as a function of NBO/BO ratio. Results indicated that the number of Ca2+ ions released into SBF solution in dissolution process and weight loss of SB-treated samples vary with NBO/BO ratio. The changes in NBO/BO ratios were observed to be proportional to HCA forming ability of barium soda lime phosphosilicate glasses.

  17. Experimental observations of the chemistry of the SiO2/Si interface

    Science.gov (United States)

    Grunthaner, F. J.; Maserjian, J.

    1977-01-01

    Changes in silicon surface preparation prior to thermal oxidation are shown to leave a signature by altering the final SiO2/Si interface structure. Surface analytical techniques, including XPS, static SIMS, ion milling, and newly developed wet-chemical profiling procedures are used to obtain detailed information on the chemical structure of the interface. The oxides are shown to be essentially SiO2 down to a narrow transitional interface layer (3-7 A). A number of discrete chemical species are observed in this interface layer, including different silicon bonds (e.g., C-, OH-, H-) and a range of oxidation states of silicon (0 to +4). The effect of surface preparation and the observed chemical species are correlated with oxide growth rate, surface-state density, and flatband shifts after irradiation.

  18. Simulation of dual-gate SOI MOSFET with different dielectric layers

    Science.gov (United States)

    Yadav, Jyoti; Chaudhary, R.; Mukhiya, R.; Sharma, R.; Khanna, V. K.

    2016-04-01

    The paper presents the process design and simulation of silicon-on-insulator (SOI)-based dual-gate metal oxide field-effect transistor (DG-MOSFET) stacked with different dielectric layers on the top of gate oxide. A detailed 2D process simulation of SOI-MOSFETs and its electrical characterization has been done using SILVACO® TCAD tool. A variation in transconductance was observed with different dielectric layers, AlN-gate MOSFET having the highest tranconductance value as compared to other three dielectric layers (SiO2, Si3N4 and Al2O3).

  19. Enhanced Photocatalytic Activity of ZrO2-SiO2 Nanoparticles by Platinum Doping

    Directory of Open Access Journals (Sweden)

    Mohammad W. Kadi

    2013-01-01

    Full Text Available ZrO2-SiO2 mixed oxides were prepared via the sol-gel method. Photo-assisted deposition was utilized for doping the prepared mixed oxide with 0.1, 0.2, 0.3, and 0.4 wt% of Pt. XRD spectra showed that doping did not result in the incorporation of Pt within the crystal structure of the material. UV-reflectance spectrometry showed that the band gap of ZrO2-SiO2 decreased from 3.04 eV to 2.48 eV with 0.4 wt% Pt doping. The results show a specific surface area increase of 20%. Enhanced photocatalysis of Pt/ZrO2-SiO2 was successfully tested on photo degradation of cyanide under illumination of visible light. 100% conversion was achieved within 20 min with 0.3 wt% of Pt doped ZrO2-SiO2.

  20. The influence of SiO2 Addition on 2MgO-Al2O3-3.3P2O5 Glass

    DEFF Research Database (Denmark)

    Larsen, P.H.; Poulsen, F.W.; Berg, Rolf W.

    1999-01-01

    2MgO-Al2O3-3.3P2O5 glasses with increasing amounts of SiO2 are considered for sealing applications in Solid Oxide Fuel Cells (SOFC). The change in chemical durability under SOFC anode conditions and the linear thermal expansion is measured as functions of the SiO2 concentration. Raman spectroscopy...

  1. Generation of interface states by injection of electrons into SiO2

    Science.gov (United States)

    Lyon, S. A.

    1984-11-01

    Several techniques have been used to inject electrons into SiO2 with various energies. Interface states are found to be generated whenever electrons flow through the oxide. However, the efficiency of interface state generation depends upon the method of electron injection. At high enough fields, positive charge is produced in the oxide which enhances the production of interface states. All of the states are amphoteric and are probably dangling Si bonds at the interface (Pb-centers).

  2. Effect of H and OH desorption and diffusion on electronic structure in amorphous In-Ga-Zn-O metal-oxide-semiconductor diodes with various gate insulators

    Science.gov (United States)

    Hino, Aya; Morita, Shinya; Yasuno, Satoshi; Kishi, Tomoya; Hayashi, Kazushi; Kugimiya, Toshihiro

    2012-12-01

    Metal-oxide-semiconductor (MOS) diodes with various gate insulators (G/Is) were characterized by capacitance-voltage characteristics and isothermal capacitance transient spectroscopy (ICTS) to evaluate the effect of H and OH desorption and diffusion on the electronic structures in amorphous In-Ga-Zn-O (a-IGZO) thin films. The density and the distribution of the space charge were found to be varied depending on the nature of the G/I. In the case of thermally grown SiO2 (thermal SiO2) G/Is, a high space-charge region was observed near the a-IGZO and G/I interface. After thermal annealing, the space-charge density in the deeper region of the film decreased, whereas remained unchanged near the interface region. The ICTS spectra obtained from the MOS diodes with the thermal SiO2 G/Is consisted of two broad peaks at around 5 × 10-4 and 3 × 10-2 s before annealing, while one broad peak was observed at around 1 × 10-4 s at the interface and at around 1 × 10-3 s in the bulk after annealing. Further, the trap density was considerably high near the interface. In contrast, the space-charge density was high throughout the bulk region of the MOS diode when the G/I was deposited by chemical vapor deposition (CVD). The ICTS spectra from the MOS diodes with the CVD G/Is revealed the existence of continuously distributed trap states, suggesting formations of high-density tail states below the conduction band minimum. According to secondary ion mass spectroscopy analyses, desorption and outdiffusion of H and OH were clearly observed in the CVD G/I sample. These phenomena could introduce structural fluctuations in the a-IGZO films, resulting in the formation of the conduction band tail states. Thin-film transistors (TFTs) with the same gate structure as the MOS diodes were fabricated to correlate the electronic properties with the TFT performance, and it was found that TFTs with the CVD G/I showed a reduced saturation mobility. These results indicate that the electronic structures

  3. Growth stress evolution in HfO2/SiO2 multilayers

    International Nuclear Information System (INIS)

    Li, Jingping; Fang, Ming; He, Hongbo; Shao, Jianda; Fan, Zhengxiu; Li, Zhaoyang

    2012-01-01

    Growth stress in hafnium oxide/silicon dioxide (HfO 2 /SiO 2 ) multilayers was measured in situ to understand the role of the sublayers and the influence of the underlayers' structural features. Experiments using three- and six-layer films were performed by electron-beam evaporation. During deposition, the developing trend of the force per unit width was controlled by changing the thickness ratio of the HfO 2 and SiO 2 layers. The substrate material affected the initial stress evolution of HfO 2 film. The structural feature of the HfO 2 layer onto which SiO 2 was deposited and the whole film thickness have a combined effect on the stress evolution of the SiO 2 layer. - Highlights: ► Film radius stress relates to thickness ratio of sublayers. ► The initial stress evolutions of HfO 2 depended on the substrate material. ► The structural feature of H layer affects the stress evolution of L layer.

  4. Effect of UV-light illumination on oxide-based electric-double-layer thin-film transistors

    Science.gov (United States)

    Zhou, Jumei; Hu, Yunping

    2017-01-01

    Indium-tin-oxide (ITO)-based thin-film transistors (TFTs) were fabricated using porous SiO2 deposited by plasma-enhanced chemical vapor deposition and Al2O3 deposited by atomic layer deposition as dielectrics. The results showed that the porous SiO2 film exhibited a high electric-double-layer (EDL) capacitance. Devices gated by the EDL dielectric exhibited a high drain current on/off ratio of >106 and a low operation voltage of <2.0 V in the dark. When illuminated by 254 nm UV light, ITO-based EDL TFTs gated by a single SiO2 dielectric displayed weak photo-responses. However, devices gated by a stacked Al2O3/EDL dielectric displayed a high photo responsivity of more than 104 with a gate bias of -0.5 V (depletion state).

  5. Functionalized sio2 microspheres for extracting oil from produced water

    KAUST Repository

    Mishra, Himanshu

    2017-03-16

    Functionalized material, methods of producing the functionalized material, and use thereof for separation processes such as but not limited to use for separating and extracting a dissolved organic foulant, charged contaminant or oily matter or any combination thereof from water, such as produced water, are provided. In an embodiment, the functionalized material is a mineral material, such as mica, silica (e.g. an SiO2 microsphere) or a metal oxide, and the outer surface of the material is functionalized with an alkyl chain or a perfluorinated species. In an embodiment, the method of making the functionalized material, includes: a) providing a mineral material; b) providing an alkyl chain and/or a perfluorinated species, the alkyl chain or perfluorinated species selected to dissolve organic foulants, charged contaminants or oily matter from water or any combination thereof; c) hydroxylating the material via a concentrated acid solution or a basic solution; and d) grafting the alkyl chain and/or the perfluorinated species onto the material via a silanation reaction.

  6. Analyzing nitrogen concentration using carrier illumination (CI) technology for DPN ultra-thin gate oxide

    International Nuclear Information System (INIS)

    Li, W.S.; Wu, Bill; Fan, Aki; Kuo, C.W.; Segovia, M.; Kek, H.A.

    2005-01-01

    Nitrogen concentration in the gate oxide plays a key role for 90 nm and below ULSI technology. Techniques like secondary ionization mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS) are commonly used for understanding N concentration. This paper describes the application of the carrier illuminationTM (CI) technique to measure the nitrogen concentration in ultra-thin gate oxides. A set of ultra-thin gate oxide wafers with different DPN (decoupled plasma nitridation) treatment conditions were measured using the CI technique. The CI signal has excellent correlation with the N concentration as measured by XPS

  7. Surface Preparation and Deposited Gate Oxides for Gallium Nitride Based Metal Oxide Semiconductor Devices

    Science.gov (United States)

    Long, Rathnait D.; McIntyre, Paul C.

    2012-01-01

    The literature on polar Gallium Nitride (GaN) surfaces, surface treatments and gate dielectrics relevant to metal oxide semiconductor devices is reviewed. The significance of the GaN growth technique and growth parameters on the properties of GaN epilayers, the ability to modify GaN surface properties using in situ and ex situ processes and progress on the understanding and performance of GaN metal oxide semiconductor (MOS) devices are presented and discussed. Although a reasonably consistent picture is emerging from focused studies on issues covered in each of these topics, future research can achieve a better understanding of the critical oxide-semiconductor interface by probing the connections between these topics. The challenges in analyzing defect concentrations and energies in GaN MOS gate stacks are discussed. Promising gate dielectric deposition techniques such as atomic layer deposition, which is already accepted by the semiconductor industry for silicon CMOS device fabrication, coupled with more advanced physical and electrical characterization methods will likely accelerate the pace of learning required to develop future GaN-based MOS technology.

  8. Enhancement of carrier mobility in pentacene thin-film transistor on SiO 2 by controlling the initial film growth modes

    Science.gov (United States)

    Qi, Qiong; Yu, Aifang; Jiang, Peng; Jiang, Chao

    2009-02-01

    Pentacene thin-film transistors (TFTs) were fabricated on thermally grown SiO 2 gate insulator under the conditions of various pre-cleaning treatments. Initial nucleation and growth of the material films on treated substrates were observed by atomic force microscope. The performance of fabricated TFT devices with different surface cleaning approaches was found to be highly related to the initial film morphologies. In contrast to the three-dimensional island-like growth mode on SiO 2 under an organic cleaning process, a layer-by-layer initial growth occurred on the SiO 2 insulator cleaned with ammonia solution, which was believed to be the origination of the excellent electrical properties of the TFT device. Field effect mobility of the TFT device could achieve as high as 1.0 cm 2/Vs on the bared SiO 2/Si substrate and the on/off ratio was over 10 6.

  9. Modelling ionising radiation induced defect generation in bipolar oxides with gated diodes

    International Nuclear Information System (INIS)

    Barnaby, H.J.; Cirba, C.; Schrimpf, R.D.; Kosier, St.; Fouillat, P.; Montagner, X.

    1999-01-01

    Radiation-induced oxide defects that degrade electrical characteristics of bipolar junction transistor (BJTs) can be measured with the use of gated diodes. The buildup of defects and their effect on device radiation response are modeled with computer simulation. (authors)

  10. Effect of ring-shaped SiO2 current blocking layer thickness on the external quantum efficiency of high power light-emitting diodes

    Science.gov (United States)

    Zhou, Shengjun; Liu, Mengling; Hu, Hongpo; Gao, Yilin; Liu, Xingtong

    2017-12-01

    A ring-shaped SiO2 CBL underneath the p-electrode was employed to enhance current spreading of GaN-based light-emitting diodes (LEDs). Effects of ring-shaped SiO2 current blocking layer (CBL) thickness on optical and electrical characteristics of high power LEDs were investigated. A 190-nm-thick ring-shaped SiO2 CBL with inclined sidewalls was obtained using a combination of a thermally reflowed photoresist technique and an inductively coupled plasma (ICP) etching process, allowing for the deposition of conformal indium tin oxide (ITO) transparent conductive layer on sidewalls of ring-shaped SiO2 CBL. It was indicated that the external quantum efficiency (EQE) of high power LEDs increased with increasing thickness of ring-shaped SiO2 CBL. The EQE of high power LED with 190-nm-thick ring-shaped SiO2 CBL was 12.7% higher than that of high power LED without SiO2 CBL. Simulations performed with commercial SimuLED software package showed that the ring-shaped SiO2 CBL could significantly alleviate current crowding around p-electrode, resulting in enhanced current spreading over the entire high power LED structure.

  11. Synthesis and Characterization of Ti-Phenyl at SiO2 Core-Shell Nanoparticles Catalyst

    International Nuclear Information System (INIS)

    Syamsi Aini; Jon Efendi; Syamsi Aini; Jon Efendi

    2012-01-01

    This study highlights the potential use of Ti-Phenyl at SiO 2 core-shell nanoparticles as heterogeneous catalysis in oxidation reaction. The Ti-Phenyl at SiO 2 was synthesized by reduction of TiCl 4 and diazonium salt with sodium borohydride to produce phenyl titanium nanoparticles (Ti-Phenyl), followed by the silica shell coating using tetraethyl orthosilicate (TEOS). The Ti-Phenyl at SiO 2 nanoparticles were characterized by Fourier transform infrared (FTIR) spectrometer, diffuse reflectance (DR) UV-visible spectrometer, thermogravimetric analyzer (TGA), X-ray diffraction (XRD) spectrometer, field emission scanning electron microscope (FESEM) and transmission electron microscope (TEM). The core-shell size of Ti-Phenyl at SiO 2 was in the range of 40 to 100 nm with its core composed with an agglomeration of Ti-Phenyl. The Ti-Phenyl at SiO 2 was active as a catalyst in the liquid phase epoxidation of 1-octene with aqueous hydrogen peroxide as an oxidant. (author)

  12. Graphene-graphite oxide field-effect transistors.

    Science.gov (United States)

    Standley, Brian; Mendez, Anthony; Schmidgall, Emma; Bockrath, Marc

    2012-03-14

    Graphene's high mobility and two-dimensional nature make it an attractive material for field-effect transistors. Previous efforts in this area have used bulk gate dielectric materials such as SiO(2) or HfO(2). In contrast, we have studied the use of an ultrathin layered material, graphene's insulating analogue, graphite oxide. We have fabricated transistors comprising single or bilayer graphene channels, graphite oxide gate insulators, and metal top-gates. The graphite oxide layers show relatively minimal leakage at room temperature. The breakdown electric field of graphite oxide was found to be comparable to SiO(2), typically ~1-3 × 10(8) V/m, while its dielectric constant is slightly higher, κ ≈ 4.3. © 2012 American Chemical Society

  13. Synthis and Phisical And Chemical; Properties of SiO2 - B2O3 and SiO2 - P2O5 Thin Film Systems and Powders

    Science.gov (United States)

    Mal'chik, A. G.; Litovkin, S. V.; Seregin, V. I.; Rodionov, P. V.; Kryuchkova, S. O.

    2016-08-01

    The SiO2 - B2O3 and SiO2 - P2O5 films were synthesized by using film forming solutions having a P2O5 content of up to 30% and B2O3 up to 40%. Properties of the filmforming solutions and binary oxides were examined. The physical and chemical processes occurring in the solution during the heat treatment of films were examined. The conditions for producing films of different thicknesses were determined. The kinetic parameters were calculated.

  14. Improved Efficiency of Flexible Organic Light-Emitting Diodes by Insertion of Ultrathin SiO2 Buffer Layers

    Directory of Open Access Journals (Sweden)

    Chien-Jung Huang

    2013-01-01

    Full Text Available An ultrathin hole-injection buffer layer (HBL using silicon dioxide (SiO2 by electron beam evaporation in flexible organic light-emitting diode (FOLED has been fabricated. While the current of the device at constant driving voltage decreases as increasing SiO2 thickness. Compared to the different thicknesses of the buffer layer, the FOLED with the buffer layer of 4 nm showed the highest luminous efficiency. The atomic force microscopy (AFM investigation of indium tin oxide (ITO/SiO2 topography reveals changes at the interface between SiO2 and N,N′-bis-(1-naphthl-diphenyl-1,1′-bipheny-4,4′-diamine (NPB, resulting in ultrathin SiO2 layers being a clear advantage for a FOLED. However, the SiO2 can be expected to be a good buffer layer material and thus enhance the emission performance of the FOLED.

  15. Vaporization of SiO2 and MgSiO3

    Science.gov (United States)

    Stixrude, L. P.; Xiao, B.

    2016-12-01

    Vaporization of SiO2 and MgSiO3B Xiaoa and L Stixrude*a, a Department of Earth Sciences, University College London, WC1E 6BT London, UK *presenting author, email: l.stixrude@ucl.ac.uk Vaporization is an important process in Earth's earliest evolution during which giant impacts are thought to have produced a transient silicate atmosphere. As experimental data are very limited, little is known of the near-critical vaporization of Earth's major oxide components: MgO and SiO2. We have performed novel ab initio molecular dynamics simulations of vapor-liquid coexistence in the SiO2 and MgSiO3 systems. The simulations, based on density functional theory using the VASP code, begin with a suitably prepared liquid slab embedded in a vacuum. During the dynamical trajectory in the canonical ensemble, we see spontaneous vaporization, leading eventually to a steady-state chemical equilibrium between the two coexisting phases. We locate the liquid-vapor critical point at 6600 K and 0.40 g/cm3 for MgSiO3 and 5300 K and 0.43 g/cm3 for SiO2. By carefully examining the trajectories, we determine the composition and speciation of the vapor. For MgSiO3, We find that the vapor is significantly richer in Mg, O, and atomic (non-molecular) species than extrapolation of low-temperature experimental data has suggested. These results will have important implications for our understanding of the initial chemistry of the Earth and Moon and the initial thermal state of Earth.

  16. Impact of metal-ion contaminated silica particles on gate oxide integrity

    NARCIS (Netherlands)

    Rink, Ingrid; Wali, F.; Knotter, D.M.

    2009-01-01

    The impact of metal-ion contamination (present on wafer surface before oxidation) on gate oxide integrity (GOI) is well known in literature, which is not the case for clean silica particles [1, 2]. However, it is known that particles present in ultra-pure water (UPW) decrease the random yield in

  17. Direct deposition of aluminum oxide gate dielectric on graphene channel using nitrogen plasma treatment

    International Nuclear Information System (INIS)

    Lim, Taekyung; Kim, Dongchool; Ju, Sanghyun

    2013-01-01

    Deposition of high-quality dielectric on a graphene channel is an essential technology to overcome structural constraints for the development of nano-electronic devices. In this study, we investigated a method for directly depositing aluminum oxide (Al 2 O 3 ) on a graphene channel through nitrogen plasma treatment. The deposited Al 2 O 3 thin film on graphene demonstrated excellent dielectric properties with negligible charge trapping and de-trapping in the gate insulator. A top-gate-structural graphene transistor was fabricated using Al 2 O 3 as the gate dielectric with nitrogen plasma treatment on graphene channel region, and exhibited p-type transistor characteristics

  18. Improving antiproliferative effect of the anticancer drug cytarabine on human promyelocytic leukemia cells by coating on Fe3O4@SiO2 nanoparticles.

    Science.gov (United States)

    Shahabadi, Nahid; Falsafi, Monireh; Mansouri, Kamran

    2016-05-01

    In this study, Fe3O4@SiO2-cytarabine magnetic nanoparticles (MNPs) were prepared via chemical coprecipitation reaction and coating silica on the surface of Fe3O4 MNPs by Stöber method via sol-gel process. The surface of Fe3O4@SiO2 MNPs was modified by an anticancer drug, cytarabine. The structural properties of the samples were characterized by X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), Zetasizer analyzer, and transmission electron microscopy (TEM). The results indicated that the crystalline phase of iron oxide NPs was magnetite (Fe3O4) and the average sizes of Fe3O4@SiO2-cytarabine MNPs were about 23 nm. Also, the surface characterization of Fe3O4@SiO2-cytarabine MNPs by FT-IR showed that successful coating of Fe3O4 NPs with SiO2 and binding of cytarabine drug onto the surface of Fe3O4@SiO2 MNPs were through the hydroxyl groups of the drug. The in vitro cytotoxic activity of Fe3O4@SiO2-cytarabine MNPs was investigated against cancer cell line (HL60) in comparison with cytarabine using MTT colorimetric assay. The obtained results showed that the effect of Fe3O4@SiO2-cytarabine magnetic nanoparticles on the cell lines were about two orders of magnitude higher than that of cytarabine. Furthermore, in vitro DNA binding studies were investigated by UV-vis, circular dichroism, and fluorescence spectroscopy. The results for DNA binding illustrated that DNA aggregated on Fe3O4@SiO2-cytarabine MNPs via groove binding. Copyright © 2016 Elsevier B.V. All rights reserved.

  19. Water Sorption in Electron-Beam Evaporated SiO2 on QCM Crystals and Its Influence on Polymer Thin Film Hydration Measurements.

    Science.gov (United States)

    Kushner, Douglas I; Hickner, Michael A

    2017-05-30

    Spectroscopic ellipsometry (SE) and quartz crystal microbalance (QCM) measurements are two critical characterization techniques routinely employed for hydration studies of polymer thin films. Water uptake by thin polymer films is an important area of study to investigate antifouling surfaces, to probe the swelling of thin water-containing ionomer films, and to conduct fundamental studies of polymer brush hydration and swelling. SiO 2 -coated QCM crystals, employed as substrates in many of these hydration studies, show porosity in the thin electron-beam (e-beam) evaporated SiO 2 layer. The water sorption into this porous SiO 2 layer requires correction of the optical and mass characterization of the hydrated polymer due to changes in the SiO 2 layer as it sorbs water. This correction is especially important when experiments on SiO 2 -coated QCM crystals are compared to measurements on Si wafers with dense native SiO 2 layers. Water adsorption filling void space during hydration in ∼200-260 nm thick SiO 2 layers deposited on a QCM crystal resulted in increased refractive index of the layer during water uptake experiments. The increased refractive index led to artificially higher polymer swelling in the optical modeling of the hydration experiments. The SiO 2 -coated QCM crystals showed between 6 and 8% void as measured by QCM and SE, accounting for 60%-85% of the measured polymer swelling in the low humidity regime (70% RH) from optical modeling for 105 and 47 nm thick sulfonated polymer films. Correcting the refractive index of the SiO 2 layer for its water content resulted in polymer swelling that successfully resembled swelling measured on a silicon wafer with nonporous native oxide.

  20. Design of flexible PANI-coated CuO-TiO2-SiO2 heterostructure nanofibers with high ammonia sensing response values

    Science.gov (United States)

    Pang, Zengyuan; Nie, Qingxin; Lv, Pengfei; Yu, Jian; Huang, Fenglin; Wei, Qufu

    2017-06-01

    We report a room-temperature ammonia sensor with extra high response values and ideal flexibility, including polyaniline (PANI)-coated titanium dioxide-silicon dioxide (TiO2-SiO2) or copper oxide-titanium dioxide-silicon dioxide (CuO-TiO2-SiO2) composite nanofibers. Such flexible inorganic TiO2-SiO2 and CuO-TiO2-SiO2 composite nanofibers were prepared by electrospinning, followed by calcination. Then, in situ polymerization of aniline monomers was carried out with inorganic TiO2-SiO2 and CuO-TiO2-SiO2 composite nanofibers as templates. Gas sensing tests at room temperature indicated that the obtained CuO-TiO2-SiO2/PANI composite nanofibers had much higher response values to ammonia gas (ca. 45.67-100 ppm) than most of those reported before as well as the prepared TiO2-SiO2/PANI composite nanofibers here. These excellent sensing properties may be due to the P-N, P-P heterojunctions and a structure similar to field-effect transistors formed on the interfaces between PANI, TiO2, and CuO, which is p-type, n-type, and p-type semiconductor, respectively. In addition, the prepared free-standing CuO-TiO2-SiO2/PANI composite nanofiber membrane was easy to handle and possessed ideal flexibility, which is promising for potential applications in wearable sensors in the future.

  1. Synthesis of metallic nanoparticles in SiO2 matrices

    International Nuclear Information System (INIS)

    Gutierrez W, C.; Mondragon G, G.; Perez H, R.; Mendoza A, D.

    2004-01-01

    Metallic nanoparticles was synthesized in SiO 2 matrices by means of a process of two stages. The first one proceeded via sol-gel, incorporating the metallic precursors to the reaction system before the solidification of the matrix. Later on, the samples underwent a thermal treatment in atmosphere of H 2 , carrying out the reduction of the metals that finally formed to the nanoparticles. Then it was detected the presence of smaller nanoparticles than 20 nm, dispersed and with the property of being liberated easily of the matrix, conserving a free surface, chemically reactive and with response to external electromagnetic radiation. The system SiO 2 -Pd showed an important thermoluminescent response. (Author)

  2. Determination of phosphorus distribution in the region of a SiO2-Si interface by substoichiometric analysis

    International Nuclear Information System (INIS)

    Shigematsu, T.; Yonezawa, H.

    1994-01-01

    A simplified method for the substoichiometric analysis of phosphorus has been developed and applied to determine the concentration distribution of phosphorus in the region of a SiO 2 -Si interface in order to explain why phosphorus is lost from the ion-implanted silicon surface throughout the oxidation and oxide removal processes. It is revealed that phosphorus piles up on the SiO 2 side at the interface by the thermal oxidation of silicon surface and is removed with the oxide by wet etching and with the resulting silicon by RCA cleaning. This results in a total loss of ion-implanted phosphorus of 3.5%. (author) 11 refs.; 2 figs.; 3 tabs

  3. Mechanism of oxide thickness and temperature dependent current conduction in n+-polySi/SiO2/p-Si structures — a new analysis

    Science.gov (United States)

    Samanta, Piyas

    2017-10-01

    The conduction mechanism of gate leakage current through thermally grown silicon dioxide (SiO2) films on (100) p-type silicon has been investigated in detail under negative bias on the degenerately doped n-type polysilicon (n+-polySi) gate. The analysis utilizes the measured gate current density J G at high oxide fields E ox in 5.4 to 12 nm thick SiO2 films between 25 and 300 °C. The leakage current measured up to 300 °C was due to Fowler–Nordheim (FN) tunneling of electrons from the accumulated n +-polySi gate in conjunction with Poole Frenkel (PF) emission of trapped-electrons from the electron traps located at energy levels ranging from 0.6 to 1.12 eV (depending on the oxide thickness) below the SiO2 conduction band (CB). It was observed that PF emission current I PF dominates FN electron tunneling current I FN at oxide electric fields E ox between 6 and 10 MV/cm and throughout the temperature range studied here. Understanding of the mechanism of leakage current conduction through SiO2 films plays a crucial role in simulation of time-dependent dielectric breakdown (TDDB) of metaloxide–semiconductor (MOS) devices and to precisely predict the normal operating field or applied gate voltage for lifetime projection of the MOS integrated circuits.

  4. Adsorption of uranyl in SiO2 porous glass

    International Nuclear Information System (INIS)

    Benedetto, F. E.; Prado, M. O.

    2013-01-01

    Vitreous SiO 2 porous matrices can be used in many applications involving the uptake of chemical species on its solid surface. In this work, vitreous silica sponges were prepared from a sodium borosilicate glass manufactured in our laboratory. The product obtained was then separated into phases with subsequent leaching of the soluble phase rich in B and Na. The resulting porous matrices have a specific surface of 35 m2/gr. Adsorption of uranyl ions onto the SiO 2 porous surface was studied to evaluate the use of this material as a filter for treatment of uranium containing water. The effects of contact time, adsorbent mass and equilibrium concentration of solution were studied. The porous adsorbent exhibits a pseudo-second-order kinetic behavior. The sponges with adsorbed uranium were thermally sealed as a way of U immobilization. Retention of uranium was confirmed during the matrix sealing by TGA. Uranium concentration before and after adsorption tests were made by means of ICP-OES. For uranium concentration of 800 ppm, 72 hours contact time and pH of 3.5, the amount of uranium adsorbed was 21.06 ± 0.02 mg U per gram of vitreous porous SiO 2 . (author)

  5. Single-electron-occupation metal-oxide-semiconductor quantum dots formed from efficient poly-silicon gate layout

    Energy Technology Data Exchange (ETDEWEB)

    Carroll, Malcolm S.; rochette, sophie; Rudolph, Martin; Roy, A. -M.; Curry, Matthew Jon; Ten Eyck, Gregory A.; Manginell, Ronald P.; Wendt, Joel R.; Pluym, Tammy; Carr, Stephen M; Ward, Daniel Robert; Lilly, Michael; pioro-ladriere, michel

    2017-07-01

    We introduce a silicon metal-oxide-semiconductor quantum dot structure that achieves dot-reservoir tunnel coupling control without a dedicated barrier gate. The elementary structure consists of two accumulation gates separated spatially by a gap, one gate accumulating a reservoir and the other a quantum dot. Control of the tunnel rate between the dot and the reservoir across the gap is demonstrated in the single electron regime by varying the reservoir accumulation gate voltage while compensating with the dot accumulation gate voltage. The method is then applied to a quantum dot connected in series to source and drain reservoirs, enabling transport down to the single electron regime. Finally, tuning of the valley splitting with the dot accumulation gate voltage is observed. This split accumulation gate structure creates silicon quantum dots of similar characteristics to other realizations but with less electrodes, in a single gate stack subtractive fabrication process that is fully compatible with silicon foundry manufacturing.

  6. In situ coating of flame-made TiO2 particles with nanothin SiO2 films.

    Science.gov (United States)

    Teleki, Alexandra; Heine, Martin C; Krumeich, Frank; Akhtar, M Kamal; Pratsinis, Sotiris E

    2008-11-04

    Rutile TiO2 particles made by flame spray pyrolysis (FSP) were coated in a single step with SiO2 layers in an enclosed flame reactor. This in situ particle coating was accomplished by a hollow ring delivering hexamethyldisiloxane (HMDSO) vapor (precursor to SiO2) through multiple jets in swirl cross-flow to Al-doped nanostructured rutile TiO2 aerosol freshly made by FSP of a solution of titanium tetraisopropoxide and aluminum sec-butoxide in xylene. The as-prepared powders were characterized by (scanning) transmission electron microscopy (STEM and TEM), energy dispersive X-ray analysis, X-ray diffraction, nitrogen adsorption, electrophoretic mobility, DC plasma optical emission (DCP-OES), and Fourier transform infrared (FT-IR) spectroscopy. The coating quality was assessed further by the photocatalytic oxidation of isopropyl alcohol to acetone. The effect of HMDSO injection point and vapor concentration on product particle morphology was investigated. The titania particles were uniformly SiO2-coated with controlled and uniform thickness at a production rate of about 30 g h(-1) and exhibited limited, if any, photoactivity. In contrast, spraying and combusting equivalent mixtures of the above Si/Al/Ti precursors in the above reactor (without delivering HMDSO through the hollow ring) resulted in particles segregated in amorphous (SiO2) and crystalline (TiO2) domains which exhibited high photocatalytic activity.

  7. Modification of Nafion membrane with biofunctional SiO2 nanofiber for proton exchange membrane fuel cells

    Science.gov (United States)

    Wang, Hang; Li, Xiaojie; Zhuang, Xupin; Cheng, Bowen; Wang, Wei; Kang, Weimin; Shi, Lei; Li, Hongjun

    2017-02-01

    Proton currents are an integral part of the most important energy-converting structures in biology. We prepared a new type of bioinspired Nafion (Bio-Nafion) membrane composited of biofunctional SiO2 (Bio-SiO2) nanofiber and Nafion matrix. SiO2 nanofibers were prepared by electrospinning silica sol prepared from tetraethyl orthosilicate. Meanwhile, Bio-SiO2 nanofibers were synthesized by immobilizing amino acids (cysteine, serine, lysine, and glycine) on SiO2 nanofibers, which acted as efficient proton-conducting pathways that involved numerous H+ transport sites. In our study, the SiO2 nanofibers biofunctionalized with cysteine were further oxidized, and the composite membranes were designated as Nafion-Cys, Nafion-Lys, Nafion-Ser, and Nafion-Gly, respectively. We then investigated the different polar groups (sbnd SO3H, sbnd OH, and sbnd NH2) of the amino acids that contributed to membrane properties of thermal stability, water uptake (WU), dimensional stability, proton conductivity, and methanol permeability. Nafion-Cys exhibited the highest proton conductivity of 0.2424 S/cm (80 °C). Nafion-Gly showed the lowest proton conductivity and WU because glycine contains the least number of hydrophilic groups among the amino acids. Overall, the introduction of Bio-SiO2 nanofiber to composite membranes significantly improved proton conductivity, dimensional stability, and methanol permeability.

  8. Impact of oxide thickness on gate capacitance – Modelling and ...

    Indian Academy of Sciences (India)

    of oxide thickness. The obtained threshold voltage is characteristic with the variation of oxide thickness and is in good agreement with the experimental results obtained by Bera et al [15]. Then, eq. (17) is plotted in MATLAB by using the necessary parameter values for. AlInN/GaN and AlGaN/GaN MOSHEMT to graphically ...

  9. The effects of various gate oxidation conditions on intrinsic and radiation-induced extrinsic charged defects and neutral electron traps

    International Nuclear Information System (INIS)

    Walters, M.; Reisman, A.

    1990-01-01

    In this paper the influence of the oxidation temperature, ambient atmosphere, and oxidation rate on intrinsic and Al Kα x-ray radiation-induced extrinsic gate oxide defect levels in insulated-gate field effect transistors (IGFETs) is studied. Using optically assisted electron injection into n-channel polysilicon-gated IGFETs, neutral electron trap and fixed negative charge defect densities were measured, in addition to the fixed positive charge density. The results indicate that radiation-induced defect densities in the gate oxide decrease with increasing oxidation temperature in the 800 degrees C to 1000 degrees C range, and are lower for dry/wet/dry oxides than for dry oxides when the oxidation temperature is below 950 degrees C, but higher when the oxidation temperature is above 950 degrees C. The oxidation rate had no effect on defect levels in dry oxides grown at 1000 degrees CX, while at an oxidation temperature of 800 degrees C, the extrinsic defect densities were observed to increase when the oxidation rate was decreased. In all cases, the radiation-induced fixed positive charge and neutral electron trap defect densities were observed to be dependent upon the gate oxidation conditions in the same fashion

  10. Design of Higher-k and More Stable Rare Earth Oxides as Gate Dielectrics for Advanced CMOS Devices

    Directory of Open Access Journals (Sweden)

    Yi Zhao

    2012-08-01

    Full Text Available High permittivity (k gate dielectric films are widely studied to substitute SiO2 as gate oxides to suppress the unacceptable gate leakage current when the traditional SiO2 gate oxide becomes ultrathin. For high-k gate oxides, several material properties are dominantly important. The first one, undoubtedly, is permittivity. It has been well studied by many groups in terms of how to obtain a higher permittivity for popular high-k oxides, like HfO2 and La2O3. The second one is crystallization behavior. Although it’s still under the debate whether an amorphous film is definitely better than ploy-crystallized oxide film as a gate oxide upon considering the crystal boundaries induced leakage current, the crystallization behavior should be well understood for a high-k gate oxide because it could also, to some degree, determine the permittivity of the high-k oxide. Finally, some high-k gate oxides, especially rare earth oxides (like La2O3, are not stable in air and very hygroscopic, forming hydroxide. This topic has been well investigated in over the years and significant progresses have been achieved. In this paper, I will intensively review the most recent progresses of the experimental and theoretical studies for preparing higher-k and more stable, in terms of hygroscopic tolerance and crystallization behavior, Hf- and La-based ternary high-k gate oxides.

  11. Formation and electrical characteristics of silicon dioxide layers by use of nitric acid oxidation method

    International Nuclear Information System (INIS)

    Imal, S.; Takahashi, M.; Matsuba, K.; Asuha; Ishikawa, Y.; Kobayashi, Hikaru

    2005-01-01

    SiO 2 /Si structure can be formed at low temperatures by use of nitric acid (HNO 3 ) oxidation of Si (NAOS) method. When Si wafers are immersed in ∼ 40 wt% HNO 3 solutions at 108 deg C, ∼ 1 nm SiO 2 layers are formed. The subsequent immersion in 68 wt% HNO 3 (i.e., azeotropic mixture of HNO 3 with water) at 121 deg C increases the SiO 2 thickness. The 3,5 nm-thick SiO 2 layers produced by this two-step NAOS method possess a considerably low leakage current density (e.g. 1 x 10 2 A/cmi 2 at the forward gate bias, V G , of 1.5 V), in spite of the low temperature oxidation, and further decreased (e.g., 8 x 10 4 A/cm 2 at V G = 1.5 V) by post-metallization annealing at 250 deg C in hydrogen atmosphere. In order to increase the SiO 2 thickness, a bias voltage is applied during the NAOS method. When 10 V is applied to Si with respect to a Pt counter electrode both immersed in 1 M HNO 3 solutions at 25 deg C, SiO 2 layers with 8 nm thickness can be formed for 1 h(Authors)

  12. Charging damage to gate oxides in an O2 magnetron plasma

    Science.gov (United States)

    Fang, Sychyi; McVittie, James P.

    1992-11-01

    A model is developed to explain how plasma etching/ashing can damage gate covered oxides via plasma nonuniformity. In addition, the role of antenna structure parameters on this damage is examined. Plasma nonuniformity leads to a local imbalance between electron and ion currents from the plasma. This imbalance of local particle currents from the plasma leads to gate charging and subsequent thin oxide degradation. This article discusses a sheath model for this charging where measurements of plasma potential nonuniformity are used to calculate the peak surface charging potential and subsequent thin oxide tunneling current. It is this oxide tunneling current that generates the surface states at the Si/SiO2 interface and the trapped charge in the oxide that degrades oxide yield and reliability. This model is applied to analyze oxide damage in an O2 magnetron plasma, via the simulation program with integrated circuits emphasis, Langmuir probe measurements, and antenna capacitor breakdown measurements. The oxide current derived from this model shows good agreement with experimental damage data of antenna capacitors. Finally, oxide damage is shown to depend on antenna structure parameters and is explained by this model.

  13. Comparative study of Laser induce damage of HfO2/SiO2 and TiO2/SiO2 mirrors at 1064 nm.

    Science.gov (United States)

    Jiao, Hongfei; Ding, Tao; Zhang, Qian

    2011-02-28

    A comparative study of laser induced damage of HfO2/SiO2 and TiO2/SiO2 mirrors at 1064 nm has been carried out. One TiO2/SiO2 mirror with absorption of 300 ppm and two HfO2/SiO2 mirrors with absorption of 40 and 4.5 ppm were fabricated using electron beam evaporation method. For r-on-1 test, all HfO2/SiO2 mirrors with low average absorption are above 150 J/cm2 at 10 ns. However, the TiO2/SiO2 mirrors with high average absorption are just 9.5 J/cm2, which are probably due to the rather high absorption and rather low band gap energy. Meanwhile, all the samples were irradiated from front and back side respectively using the raster scan test mode. In case of front side irradiation, it is found that: for TiO2/SiO2 high reflectors, the representative damage morphologies are shallow pits that were probably caused by absorbing centers. However, for HfO2/SiO2 high reflectors, the dominant damage morphologies are micrometer-sized nodules ejected pits and the delamination initiating from the pits. The absorption of HfO2/SiO2 coatings is low enough to have minor influence on the laser damage resistance. In case of backside irradiation, the morphology of TiO2/SiO2 mirrors is mainly center melted pits that are thermal melting induced damage. Meanwhile, HfO2/SiO2 mirrors with isometrical fracture rings damage morphology are thermal induced stress damage.

  14. Characterization of Si nanocrystals into SiO2 matrix

    International Nuclear Information System (INIS)

    Gravalidis, C.; Logothetidis, S.; Hatziaras, N.; Laskarakis, A.; Tsiaoussis, I.; Frangis, N.

    2006-01-01

    Silicon nanocrystals (nc-Si) have gained great interest due to their excellent optical and electronic properties and their applications in optoelectronics. The aim of this work is the study of growth mechanism of nc-Si into a-SiO 2 matrix from SiO/SiO 2 multilayer annealing, using non-destructive and destructive techniques. The multilayer were grown by e-beam evaporation from SiO and SiO 2 materials and annealing at temperatures up to 1100 deg. C in N 2 atmosphere. X-rays reflectivity (XRR) and high resolution transmission electron microscopy (HRTEM) were used for the structural characterization and spectroscopic ellipsometry in IR (FTIRSE) energy region for the study of the bonding structure. The ellipsometric results gave a clear evidence of the formation of an a-SiO 2 matrix after the annealing process. The XRR data showed that the density is being increased in the range from 25 to 1100 deg. C. Finally, the HRTEM characterization proved the formation of nc-Si. Using the above results, we describe the growth mechanism of nc-Si into SiO 2 matrix under N 2 atmosphere

  15. Bacterial adherence to SiO2-based multifunctional bioceramics.

    Science.gov (United States)

    Kinnari, Teemu J; Esteban, Jaime; Gomez-Barrena, Enrique; Zamora, Nieves; Fernandez-Roblas, Ricardo; Nieto, Alejandra; Doadrio, Juan C; López-Noriega, Adolfo; Ruiz-Hernández, Eduardo; Arcos, Daniel; Vallet-Regí, María

    2009-04-01

    The bacterial adherence onto different multifunctional silica-based bioceramics has been evaluated. Staphylococcus aureus and Staphylococcus epidermidis were chosen, as they cause the majority of the implant-related infections in this field. Two SiO2 mesoporous materials (MCM-41, SBA-15), an ordered SiO2-CaO-P2O5 mesoporous glass (OMG), and a biphasic magnetic bioceramic (BMB), were incubated with S. aureus and S. epidermidis for 90 min, and subsequently sonicated to quantify the number of adhered bacteria on each material. It was found that S. aureus and S. epidermidis (10(8) CFU/mL) adhered significantly less to BMB samples when compared to MCM-41, SBA-15, or OMG. However, when the material pores accessible for bacteria in each material were taken into account, the lowest bacterial adherence was found in MCM-41, and the highest in SBA-15. The results show that bacterial adherence is higher on mesoporous bioceramics, although this higher microbial attachment is mainly due to the intergranular porosity and grain size morphology rather than to the mesoporous structure. Copyright 2008 Wiley Periodicals, Inc.

  16. Interactions of atomic hydrogen with amorphous SiO2

    Science.gov (United States)

    Yue, Yunliang; Wang, Jianwei; Zhang, Yuqi; Song, Yu; Zuo, Xu

    2018-03-01

    Dozens of models are investigated by the first-principles calculations to simulate the interactions of an atomic hydrogen with a defect-free random network of amorphous SiO2 (a-SiO2) and oxygen vacancies. A wide variety of stable configurations are discovered due to the disorder of a-SiO2, and their structures, charges, magnetic moments, spin densities, and density of states are calculated. The atomic hydrogen interacts with the defect-free a-SiO2 in positively or negatively charged state, and produces the structures absent in crystalline SiO2. It passivates the neutral oxygen vacancies and generates two neutral hydrogenated E‧ centers with different Si dangling bond projections. Electron spin resonance parameters, including Fermi contacts, and g-tensors, are calculated for these centers. The atomic hydrogen interacts with the positive oxygen vacancies in dimer configuration, and generate four different positive hydrogenated defects, two of which are puckered like the Eγ‧ centers. This research helps to understand the interactions between an atomic hydrogen, and defect-free a-SiO2 and oxygen vacancies, which may generate the hydrogen-complexed defects that play a key role in the degeneration of silicon/silica-based microelectronic devices.

  17. Oxide-based synaptic transistors gated by solution-processed gelatin electrolytes

    Science.gov (United States)

    He, Yinke; Sun, Jia; Qian, Chuan; Kong, Ling-An; Gou, Guangyang; Li, Hongjian

    2017-04-01

    In human brain, a large number of neurons are connected via synapses. Simulation of the synaptic behaviors using electronic devices is the most important step for neuromorphic systems. In this paper, proton conducting gelatin electrolyte-gated oxide field-effect transistors (FETs) were used for emulating synaptic functions, in which the gate electrode is regarded as pre-synaptic neuron and the channel layer as the post-synaptic neuron. In analogy to the biological synapse, a potential spike can be applied at the gate electrode and trigger ionic motion in the gelatin electrolyte, which in turn generates excitatory post-synaptic current (EPSC) in the channel layer. Basic synaptic behaviors including spike time-dependent EPSC, paired-pulse facilitation (PPF), self-adaptation, and frequency-dependent synaptic transmission were successfully mimicked. Such ionic/electronic hybrid devices are beneficial for synaptic electronics and brain-inspired neuromorphic systems.

  18. Interface passivation and trap reduction via hydrogen fluoride for molybdenum disulfide on silicon oxide back-gate transistors

    Science.gov (United States)

    Hu, Yaoqiao; San Yip, Pak; Tang, Chak Wah; Lau, Kei May; Li, Qiang

    2018-04-01

    Layered semiconductor molybdenum disulfide (MoS2) has recently emerged as a promising material for flexible electronic and optoelectronic devices because of its finite bandgap and high degree of gate control. Here, we report a hydrogen fluoride (HF) passivation technique for improving the carrier mobility and interface quality of chemical vapor deposited monolayer MoS2 on a SiO2/Si substrate. After passivation, the fabricated MoS2 back-gate transistors demonstrate a more than double improvement in average electron mobility, a reduced gate hysteresis gap of 3 V, and a low interface trapped charge density of ˜5.8 × 1011 cm-2. The improvements are attributed to the satisfied interface dangling bonds, thus a reduction of interface trap states and trapped charges. Surface x-ray photoelectron spectroscopy analysis and first-principles simulation were performed to verify the HF passivation effect. The results here highlight the necessity of a MoS2/dielectric passivation strategy and provides a viable route for enhancing the performance of MoS2 nano-electronic devices.

  19. Concentration effect of Tm3+ on cathodoluminescence properties of SiO2: Tm3+ and SiO2:Ho3+, Tm3+ systems

    CSIR Research Space (South Africa)

    Dhlamini, MS

    2012-05-01

    Full Text Available .physb.2011.09.091 Concentration effect of Tm3+ on cathodoluminescence properties of SiO2: Tm 3+ and SiO2:Ho 3+, Tm3+ systems M.S. Dhlamini, G.H. Mhlongo, H.C. Swart, O.M. Ntwaeaborwa, K.T. Hillie ABSTRACT: Cathodoluminescence (CL) properties of SiO...

  20. Effect of Commercial SiO2 and SiO2 from rice husk ash loading on biodegradation of Poly (lactic acid) and crosslinked Poly (lactic acid)

    Science.gov (United States)

    Prapruddivongs, C.; Apichartsitporn, M.; Wongpreedee, T.

    2017-09-01

    In this work, biodegradation behavior of poly (lactic acid) (PLA) and crosslinked PLA filled with two types of SiO2, precipitated SiO2 (commercial SiO2) and SiO2 from rice husk ash, were studied. Rice husks were first treated with 2 molar hydrochloric acid (HCl) to produce high purity SiO2, before burnt in a furnace at 800°C for 6 hours. All components were melted bending by an internal mixer then hot pressed using compression molder to form tested specimens. FTIR spectra of SiO2 and PLA samples were investigated. The results showed the lack of silanol group (Si-OH) of rice husk ash after steric acid surface modification, while the addition of particles can affect the crosslinking of the PLA. For biodegradation test by evaluating total amount of carbon dioxide (CO2) evolved during 60 days incubation at a controlled temperature of 58±2°C, the results showed that the biodegradation of crosslinked PLA occurred slower than the neat PLA. However, SiO2 incorporation enhanced the degree of biodegradation In particular, introducing commercial SiO2 in PLA and crosslinked PLA tended to clearly increase the degree of biodegradation as a consequence of the more accelerated hydrolysis degradation.

  1. Hole trapping in E-beam irradiated SiO2 films

    Science.gov (United States)

    Aitken, J. M.; Dekeersmaecker, R. F.

    1990-07-01

    Low energy (25 kV) electron beam irradiation of MOS capacitors is shown to produce neutral hole traps in thin ‘radiation hardened’ SiO2 films. These traps are found in an uncharged state after irradiation and are populated by passing a small hole current, generated by avalanche breakdown of the n-type silicon substrate, through the oxide. From the time dependence of the observed trapping, a capture cross-section between 1 × 10˜-13 and 1 × 10-14 cm2 is deduced. The trap density is found to depend on the annealing conditions and incident electron beam dosage. The density of traps increases with incident electron beam exposure. Once introduced into the oxide by the radiation the traps can be removed by thermal anneals at temperatures above 500° C. Parallels between electron and hole trapping on these neutral centers are strong evidence for an amphoteric uncharged trap generated by ionizing radiation.

  2. Emission Mechanisms of Si Nanocrystals and Defects in SiO2 Materials

    Directory of Open Access Journals (Sweden)

    José Antonio Rodríguez

    2014-01-01

    Full Text Available Motivated by the necessity to have all silicon optoelectronic circuits, researchers around the world are working with light emitting silicon materials. Such materials are silicon dielectric compounds with silicon content altered, such as silicon oxide or nitride, enriched in different ways with Silicon. Silicon Rich Oxide or silicon dioxide enriched with silicon, and silicon rich nitride are without a doubt the most promising materials to reach this goal. Even though they are subjected to countless studies, the light emission phenomenon has not been completely clarified. So, a review of different proposals presented to understand the light emission phenomenon including emissions related to nanocrystals and to point defects in SiO2 is presented.

  3. Effect of CaO/ SiO2 ratio on viscosity and structure of slag

    Directory of Open Access Journals (Sweden)

    L. Řeháčková

    2015-07-01

    Full Text Available The objective of this work is experimental determination of temperature dependences of viscosity of the molten CaO – Al2O3 - SiO2 system and assessment of impact of CaO/SiO2 ratio on viscosity and structure of this system. Experimental measurements of viscosity were performed with use of the high-temperature viscometer Anton Paar FRS 1 600. Viscosity was measured in a rotational mode during heating at the rate of 3,3 °C/min in the temperature interval from 1 673 to 1 873 K. Viscosity in the molten oxide system is determined by the internal structure. Exact clarification of the change of structure of the oxide system caused by the increased content of CaO was performed by Fourier transform infrared spectroscopy.

  4. "Embedded Emitters": Direct bandgap Ge nanodots within SiO2

    Science.gov (United States)

    Kuo, M. H.; Chou, S. K.; Pan, Y. W.; Lin, S. D.; George, T.; Li, P. W.

    2016-12-01

    Microdisk-arrays of vertically stacked 30-70 nm Ge nanodots embedded within SiO2 were fabricated using thermal oxidation of Si0.75Ge0.25 abacus-shaped pillars and followed by post-annealing in oxygen-deficient conditions. The Ge nanodots are subjected to increasing quantum-confinement and tensile-strain by reducing dot size. We show that considerable quantum-confinement and tensile-strain can be generated within 30 nm Ge nanodots embedded in SiO2, as evidenced by large Raman red shifts for the Ge-Ge phonon lines in comparison to that for bulk Ge. These large quantum-confinement and tensile-strain facilitate direct-bandgap photoluminescence experimentally observed for the Ge nanodots, and are consistent with the strain-split photoluminescence transitions to the light-hole (LH) and heavy-hole (HH) valence bands at 0.83 eV and 0.88 eV, respectively. Time-resolved photoluminescence measurements conducted from 10-100 K show temperature-insensitive carrier lifetimes of 2.7 ns and 5 ns for the HH and LH valence-band transitions, respectively, providing additional strong evidence of direct bandgap photoluminescence for tensile-strained Ge nanodots.

  5. Location of trapped charge in aluminum-implanted SiO2

    International Nuclear Information System (INIS)

    DiMaria, D.J.; Young, D.R.; Hunter, W.R.; Serrano, C.M.

    1978-01-01

    The position of the centroid of electrons trapped on sites resulting from aluminum implantation into SiO 2 is measured by using the photo I-V technique for energies from 15 to 40 keV, oxide thicknesses from 49 to 140 nm, and post-implant annealing temperature from 600 to 1050 0 C in N 2 for 30 min. The centroid of the trapped electrons is found to be identical to that of the implanted aluminum from SIMS measurements, regardless of annealing temperature from 600 to 1050 0 C, and located closer (by less than 9 nm) to the Al--SiO 2 interface than predicted from the Lindhard-Scharff-Schott (LSS) calculations of Gibbons, Johnson, and Mylroie. Comparison of centroids determined from photo I-V and SIMS measurements as a function of SiO 2 thickness also implies that the distributions of the ions and negative trapped charge are the same. The trapping behavior of these sites is discussed in the accompanying paper by Young et al

  6. Effect of weak metallic contamination on silicon epitaxial layer and gate oxide integrity

    Energy Technology Data Exchange (ETDEWEB)

    Mello, D.; Coccorese, C.; Ferlito, E.; Sciuto, G.; Ricciari, R.; Barbarino, P.; Astuto, M. [STMicroelectronics, Physics Lab. Stradale primosole, 50 I-95121 Catania (Italy)

    2011-08-15

    The detection of metallic contaminants in microelectronics devices is one of the main issues in production line. In fact they could diffuse rapidly into the silicon bulk and establishing energy states into the silicon energy-band gap. The presence of trace of metals on the silicon surface can also degrade the gate oxide integrity, cause structural defect in silicon epitaxial layers or anomalies in silicon/gate oxide interface. Usually in semiconductor manufacturing superficial metallic contamination is monitored using Total X-ray Reflection Fluorescence spectroscopy (TXRF) and performing specific electrical measurements on dedicated capacitor. In this work a weak contamination, undetected by TXRF analysis, was revealed by Transmission Electron Microscopy (TEM) observing lattice damaging and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) detecting an anomalous Na distribution in depth profile. (copyright 2011 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

  7. Thermoluminescence of ion-implanted SiO2

    International Nuclear Information System (INIS)

    Arnold, G.W.

    1976-01-01

    Thermoluminescence (TL) has been measured from room temperature to 500 0 C for ion-implanted fused silica glasses, crystalline synthetic quartz and rf-sputtered SiO 2 films. Measurements of the TL spectra for widely varying values of electronic and atomic energy depositions, along with the known impurity concentrations of the various systems, has allowed some of the TL features to be identified. In particular, (1) a TL peak at 150 0 C in fused silica has been identified with defects formed by structural modification, (2) a 330 0 C peak in crystalline quartz and relatively impure fused silica is tentatively assigned to a center involving Al, (3) a 100 0 C peak, common to all silicas may be related to oxygen vacancies, and (4) an approximately 200 0 C peak may be the analog of the 245 nm impurity absorption band seen in some fused silica glasses

  8. Two-dimensional analytical model for hetero-junction double-gate tunnel field-effect transistor with a stacked gate-oxide structure

    Science.gov (United States)

    Xu, Hui Fang; Gui Guan, Bang

    2017-05-01

    A two-dimensional analytical model for hetero-junction double-gate tunnel FETs (DG TFETs) with a stacked gate-oxide structure is proposed in this paper. The effects of both the channel mobile charges and source/drain depletion regions on the channel potential profile are considered for the higher accuracy of the proposed model. Poisson’s equation is solved using the superposition principle and Fourier series solution to model the channel potential. The band-to-band tunneling generation rate is expressed as a function of the channel electric field derived from the channel potential and then integrated analytically to derive the drain current of the hetero-junction DG TFETs with a stacked gate-oxide structure using the shortest tunneling path. The effects of device parameters on the channel potential, drain current, and transconductance are investigated. Very good agreements are observed between the model calculations and the simulated results.

  9. Direct fabrication of hybrid nanofibres composed of SiO2-PMMA nanospheres via electrospinning.

    Science.gov (United States)

    Zhang, Ran; Shang, Tinghua; Yang, Guang; Jia, Xiaolong; Cai, Qing; Yang, Xiaoping

    2016-08-01

    The direct fabrication of hybrid nanofibres composed of poly(methyl methacrylate)-grafted SiO2 (SiO2-PMMA) nanospheres via electrospinning was investigated in detail. SiO2-PMMA nanospheres were successfully prepared, with the SiO2 nanospheres synthesized via the Stober method, followed by in situ surface-initiated atom transfer radical polymerization of methyl methacrylate (MMA). Electrospinning was carried out with N,N-dimethylformamide (DMF) as the solvent to disperse SiO2-PMMA nanospheres. The size of the SiO2 core, the molecular weight of the PMMA shell and the concentration of the SiO2-PMMA/DMF solution all had substantial effects on the morphology and structure of electrospun nanofibres composed of SiO2-PMMA nanospheres. When these determining factors were well-tailored, it was found that one-dimensional necklace-like nanofibres were obtained, with SiO2-PMMA nanospheres aligned one by one along the fibre. The successful fabrication of nanofibres by directly electrospinning the SiO2-PMMA/DMF solution verified that polymer-grafted particles possess polymer-like characteristics, which endowed them with the ability to be processed into desirable shapes and structures. Copyright © 2016 Elsevier B.V. All rights reserved.

  10. Gate-stack engineering for self-organized Ge-dot/SiO2/SiGe-shell MOS capacitors

    Science.gov (United States)

    Lai, Wei-Ting; Yang, Kuo-Ching; Liao, Po-Hsiang; George, Tom; Li, Pei-Wen

    2016-02-01

    We report the first-of-its-kind, self-organized gate-stack heterostructure of Ge-dot/SiO2/SiGe-shell on Si fabricated in a single step through the selective oxidation of a SiGe nano-patterned pillar over a Si3N4 buffer layer on a Si substrate. Process-controlled tunability of the Ge-dot size (7.5-90 nm), the SiO2 thickness (3-4 nm), and as well the SiGe-shell thickness (2-15 nm) has been demonstrated, enabling a practically-achievable core building block for Ge-based metal-oxide-semiconductor (MOS) devices. Detailed morphologies, structural, and electrical interfacial properties of the SiO2/Ge-dot and SiO2/SiGe interfaces were assessed using transmission electron microscopy, energy dispersive x-ray spectroscopy, and temperature-dependent high/low-frequency capacitance-voltage measurements. Notably, NiGe/SiO2/SiGe and Al/SiO2/Ge-dot/SiO2/SiGe MOS capacitors exhibit low interface trap densities of as low as 3-5x10^11 cm^-2·eV^-1 and fixed charge densities of 1-5x10^11 cm^-2, suggesting good-quality SiO2/SiGe-shell and SiO2/Ge-dot interfaces. In addition, the advantage of having single-crystalline Si1-xGex shell (x > 0.5) in a compressive stress state in our self-aligned gate-stack heterostructure has great promise for possible SiGe (or Ge) MOS nanoelectronic and nanophotonic applications.

  11. A chemiluminescence biosensor based on the adsorption recognition function between Fe3O4@SiO2@GO polymers and DNA for ultrasensitive detection of DNA

    Science.gov (United States)

    Sun, Yuanling; Li, Jianbo; Wang, Yanhui; Ding, Chaofan; Lin, Yanna; Sun, Weiyan; Luo, Chuannan

    2017-05-01

    In this work, a chemiluminescence (CL) biosensor was prepared for ultrasensitive determination of deoxyribonucleic acid (DNA) based on the adsorption recognition function between core-shell Fe3O4@SiO2 - graphene oxide (Fe3O4@SiO2@GO) polymers and DNA. The Fe3O4@SiO2@GO polymers were composed by GO and magnetite nanoparticles. And the core-shell polymers were confirmed by Scanning Electron Microscope (SEM), X-Ray Powder Diffraction (XRD) and Fourier Transform Infrared (FTIR). Then Fe3O4@SiO2@GO was modified by DNA. Based on the principle of complementary base, Fe3O4@SiO2@GO-DNA was introduced to the CL system and the selectivity, sensitivity of DNA detection was significantly improved. The adsorption properties of Fe3O4@SiO2@GO to DNA were researched through the adsorption equilibrium, adsorption kinetic and thermodynamics. Under optimized CL conditions, DNA could be assayed with the linear concentration range of 5.0 × 10- 12-2.5 × 10- 11 mol/L. The detection limit was 1.7 × 10- 12 mol/L (3δ) and the relative standard deviation (RSD) was 3.1%. The biosensor was finally used for the determination of DNA in laboratory samples and recoveries ranged from 99% to 103%. The satisfactory results revealed the potential application of Fe3O4@SiO2@GO-DNA-CL biosensor in the diagnosis and the treatment of human genetic diseases.

  12. Improving pH sensitivity by field-induced charge regulation in flexible biopolymer electrolyte gated oxide transistors

    Science.gov (United States)

    Liu, Ning; Gan, Lu; Liu, Yu; Gui, Weijun; Li, Wei; Zhang, Xiaohang

    2017-10-01

    Electrical manipulation of charged ions in electrolyte-gated transistors is crucial for enhancing the electric-double-layer (EDL) gating effect, thereby improving their sensing abilities. Here, indium-zinc-oxide (IZO) based thin-film-transistors (TFTs) are fabricated on flexible plastic substrate. Acid doped chitosan-based biopolymer electrolyte is used as the gate dielectric, exhibiting an extremely high EDL capacitance. By regulating the dynamic EDL charging process with special gate potential profiles, the EDL gating effect of the chitosan-gated TFT is enhanced, and then resulting in higher pH sensitivities. An extremely high sensitivity of ∼57.8 mV/pH close to Nernst limit is achieved when the gate bias of the TFT sensor sweeps at a rate of 10 mV/s. Additionally, an enhanced sensitivity of 2630% in terms of current variation with pH range from 11 to 3 is realized when the device is operated in the ion depletion mode with a negative gate bias of -0.7 V. Robust ionic modulation is demonstrated in such chitosan-gated sensors. Efficiently driving the charged ions in the chitosan-gated IZO-TFT provides a new route for ultrasensitive, low voltage, and low-cost biochemical sensing technologies.

  13. The Experimental Degradation of Microorganisms Exposed to Mn(II) and SiO2 Over Time

    Science.gov (United States)

    Schelble, R. T.; Hall, J. A.; Fogel, M. L.; Jahnke, L. L.; Nealson, K. H.; Steele, A.

    2005-12-01

    The sedimentary origin of early Proterozoic massive manganese deposits in the geological record is often attributed in part to the impact of biological processes. Although it seems possible that widespread algal blooms in near-shore oceanic environments caused the oxidation of reduced manganese from ocean waters, direct evidence of microorganisms (i.e. microfossils or chemical biosignatures) have not been identified in early Proterozoic manganiferous deposits. The purpose of this study was to identify the potential for biosignature preservation in remnant ancient manganese deposits by monitoring the degradation of modern microorganisms exposed to varying concentrations of Mn(II). Given that most early Proterozoic microfossils have been found in siliceous rocks, similar experiments were carried out using silica-rich solutions for comparison. Bacillus subtilis (gram-positive) and Escherichia coli (gram-negative) were exposed to various Mn(II)- and silica-rich solutions over a period of 180 days. The degradation of a short-duration biomarker (DNA), and longer-duration biomarkers (phospholipid fatty acids and their derivative n-alkanes) were investigated. The degradation of DNA was quantified using real time PCR (RT-PCR) and microorganism specific and general bacteria primers. DNA longevity decreased with higher concentrations of manganese (up to 1000 ppm Mn(II)) when compared with control microorganisms suspended in solutions without manganese. This effect was more dramatic in the E. coli incubations. Relatively steady decreases in the longevity of B. subtilis DNA were observed when cells were exposed to Mn(II). This may be due to the ability of the organism to sporulate, which may protect the DNA from rapid degradation. B. subtilis DNA persisted longer when cells were exposed to undersaturated SiO2 solution (100 ppm SiO2), than those exposed to supersaturated SiO2 solutions (1000 ppm and 3000 ppm). The preservation potential of E. coli DNA showed no differences

  14. The comparison of gamma-radiation and electrical stress influences on oxide and interface defects in power VDMOSFET

    Directory of Open Access Journals (Sweden)

    Đorić-Veljković Snežana M.

    2013-01-01

    Full Text Available The behaviour of oxide and interface defects in n-channel power vertical double-diffused metal-oxide-semiconductor field-effect transistors, firstly degraded by the gamma-irradiation and electric field and subsequently recovered and annealed, is presented. By analyzing the transfer characteristic shifts, the changes of threshold voltage and underlying changes of gate oxide and interface trap densities during the stress (recovery, annealing of investigated devices, it is shown that these two types of stress influence differently on the gate oxide and the SiO2-Si interface. [Projekat Ministarstva nauke Republike Srbije, br. OI171026

  15. Enhancement of Electrical Conductance for Pentacene Thin Film Transistor by Controlling an Initial Layer-by-Layer Growth Mode Directly on SiO2 Insulator

    Science.gov (United States)

    Qi, Qiong; Jiang, Yeping; Yu, Aifang; Qiu, Xiaohui; Jiang, Chao

    2009-04-01

    Initial nucleation and growth of pentacene films on various pre-cleaning treated SiO2 gate insulators were systematically examined by atomic force microscope. The performance of fabricated pentacene thin film transistor devices was found to be highly related to the initial film growth modes. In contrast to the film in the three-dimensional island-like growth mode on SiO2 under an organic cleaning process, a layer-by-layer initial growth mode occurred on the SiO2 insulator cleaned with ammonia solution which has shown much improved electrical properties of the thin film transistors. Field effect mobility of the thin film transistor devices could be achieved as high as 1.0 cm2 V-1 s-1 on the bared SiO2/Si substrate and the on/off ratio was over 106. The enhanced electrical conductance was further confirmed by an electrostatic force microscopic observation of quantized electrical potentials via charge-injection to the submonolayer pentacene islands with layer-by-layer growth mode.

  16. Origin of the n -type and p -type conductivity of MoS 2 monolayers on a SiO 2 substrate

    KAUST Repository

    Dolui, Kapildeb

    2013-04-02

    Ab initio density functional theory calculations are performed to study the electronic properties of a MoS2 monolayer deposited over a SiO 2 substrate in the presence of interface impurities and defects. When MoS2 is placed on a defect-free substrate, the oxide plays an insignificant role since the conduction band top and the valence band minimum of MoS2 are located approximately in the middle of the SiO2 band gap. However, if Na impurities and O dangling bonds are introduced at the SiO2 surface, these lead to localized states, which modulate the conductivity of the MoS2 monolayer from n- to p-type. Our results show that the conductive properties of MoS2 deposited on SiO 2 are mainly determined by the detailed structure of the MoS 2/SiO2 interface, and suggest that doping the substrate can represent a viable strategy for engineering MoS2-based devices. © 2013 American Physical Society.

  17. Performance of organic field effect transistors with high-k gate oxide after application of consecutive bias stress

    Energy Technology Data Exchange (ETDEWEB)

    Lee, Sunwoo; Choi, Changhwan; Lee, Kilbock [Department of Materials Science and Engineering, Hanyang University, Seoul, 133-791 (Korea, Republic of); Cho, Joong Hwee [Department of Embedded Systems Engineering,University of Incheon, Incheon 406-722 (Korea, Republic of); Ko, Ki-Young [Korea Institute of Patent Information, Seoul, 146-8 (Korea, Republic of); Ahn, Jinho, E-mail: jhahn@hanyang.ac.kr [Department of Materials Science and Engineering, Hanyang University, Seoul, 133-791 (Korea, Republic of)

    2012-10-30

    We report the effect of consecutive electrical stress on the performance of organic field effect transistors (OFETs). Sputtered aluminum oxide (Al{sub 2}O{sub 3}) and hafnium oxide (HfO{sub 2}) were used as gate oxide layers. After the electrical stress, the threshold voltage, which strongly depends on bulk defects, was remarkably shifted to the negative direction, while the other performance characteristics of OFETs such as on-current, transconductance and mobility, which are sensitive to interface defects, were slightly decreased. This result implies that the defects in the bulk layer are significantly affected compared to the defects in the interface layer. Thus, it is important to control the defects in the pentacene bulk layer in order to maintain the good reliabilities of pentacene devices. Those defects in HfO{sub 2} gate oxide devices were larger compared to those in Al{sub 2}O{sub 3} gate oxide devices.

  18. Influence of implantation energy on the electrical properties of ultrathin gate oxides grown on nitrogen implanted Si substrates

    International Nuclear Information System (INIS)

    Kapetanakis, E.; Skarlatos, D.; Tsamis, C.; Normand, P.; Tsoukalas, D.

    2003-01-01

    Metal-oxide-semiconductor tunnel diodes with gate oxides, in the range of 2.5-3.5 nm, grown either on 25 or 3 keV nitrogen-implanted Si substrates at (0.3 or 1) x10 15 cm -2 dose, respectively, are investigated. The dependence of N 2 + ion implant energy on the electrical quality of the growing oxide layers is studied through capacitance, equivalent parallel conductance, and gate current measurements. Superior electrical characteristics in terms of interface state trap density, leakage current, and breakdown fields are found for oxides obtained through 3 keV nitrogen implants. These findings together with the full absence of any extended defect in the silicon substrate make the low-energy nitrogen implantation technique an attractive option for reproducible low-cost growth of nanometer-thick gate oxides

  19. Proton Conducting Graphene Oxide/Chitosan Composite Electrolytes as Gate Dielectrics for New-Concept Devices.

    Science.gov (United States)

    Feng, Ping; Du, Peifu; Wan, Changjin; Shi, Yi; Wan, Qing

    2016-09-30

    New-concept devices featuring the characteristics of ultralow operation voltages and low fabrication cost have received increasing attention recently because they can supplement traditional Si-based electronics. Also, organic/inorganic composite systems can offer an attractive strategy to combine the merits of organic and inorganic materials into promising electronic devices. In this report, solution-processed graphene oxide/chitosan composite film was found to be an excellent proton conducting electrolyte with a high specific capacitance of ~3.2 μF/cm 2 at 1.0 Hz, and it was used to fabricate multi-gate electric double layer transistors. Dual-gate AND logic operation and two-terminal diode operation were realized in a single device. A two-terminal synaptic device was proposed, and some important synaptic behaviors were emulated, which is interesting for neuromorphic systems.

  20. Gate controlled magnetoresistance in a silicon metal-oxide-semiconductor field-effect-transistor

    Science.gov (United States)

    Ciccarelli, C.; Park, B. G.; Ogawa, S.; Ferguson, A. J.; Wunderlich, J.

    2010-08-01

    We present a study of the magnetoresistance (MR) of a Si metal-oxide-semiconductor field-effect-transistor (MOSFET) at the break-down regime when a magnetic field is applied perpendicular to the plane of the device. We have identified two different regimes where we observe a large and gate-voltage dependent MR. We suggest two different mechanisms which can explain the observed high MR. Moreover, we have studied how the MR of the MOSFET scales with the dimensions of the channel for gate voltages below the threshold. We observed a decrease in the MR by two orders of magnitude by reducing the dimensions of the channel from 50×280 μm2 to 5×5 μm2.

  1. Anomalous positive flatband voltage shifts in metal gate stacks containing rare-earth oxide capping layers

    KAUST Repository

    Caraveo-Frescas, J. A.

    2012-03-09

    It is shown that the well-known negative flatband voltage (VFB) shift, induced by rare-earth oxide capping in metal gate stacks, can be completely reversed in the absence of the silicon overlayer. Using TaN metal gates and Gd2O3-doped dielectric, we measure a ∼350 mV negative shift with the Si overlayer present and a ∼110 mV positive shift with the Si overlayer removed. This effect is correlated to a positive change in the average electrostatic potential at the TaN/dielectric interface which originates from an interfacial dipole. The dipole is created by the replacement of interfacial oxygen atoms in the HfO2 lattice with nitrogen atoms from TaN.

  2. Toluene and chlorobenzene dinitration over solid H3PO4/MoO3/SiO2 catalyst

    International Nuclear Information System (INIS)

    Adamiak, Joanna; Kalinowska-Alichnewicz, Dorota; Szadkowski, Michal; Skupinski, Wincenty

    2011-01-01

    Highlights: → A novel catalyst H 3 PO 4 /MoO 3 /SiO 2 was characterized and used in nitration. → On the surface domains of phosphomolybdic acid (HPM) are obtained. → Dinitrotoluene is obtained with very high yield i.e. 96 wt.% in mild conditions. → Dinitrochlorobenzene is obtained with only twelve-fold excess of nitric acid. → It is sulfuric acid free and solvent free nitration of aromatic compounds. - Abstract: A new catalyst, H 3 PO 4 /MoO 3 /SiO 2 , was prepared by modification of MoO 3 /SiO 2 using phosphoric acid. The characterization of the catalyst was performed using Infrared and Raman Spectroscopy, potentiometric titration and nitrogen adsorption-desorption methods. Molybdenum oxides were identified along with phosphomolybdic acid and polymolybdates on the modified surface. The suitability of the catalysts for toluene and chlorobenzene nitration in continuous process was examined. Toluene is effectively nitrated to dinitrotoluene (DNT) in one-stage process (96 wt.% of DNT in the product) and in mild conditions i.e. at room temperature and only with ten-fold excess of nitric acid. In chlorobenzene nitration only twelve-fold excess of nitric acid is needed to obtain as high yield as 95 wt.%. Most importantly, the novel catalysts we have developed, provide the opportunity for sulfuric acid- free nitration of aromatic compounds.

  3. Synthesis and Luminescence Properties of Yellow-emitting SiO2/Zn2SiO4: Mn Nanocomposite

    Directory of Open Access Journals (Sweden)

    Karim OMRI

    2014-05-01

    Full Text Available Yellow light emitting Mn2+-doped b-Zn2SiO4 phosphor nanoparticles embedded in SiO2 host matrix, were prepared by a simple solid-phase reaction under natural atmosphere at 1500 °C for 2 hours after the incorporation of manganese doped zinc oxide nanoparticles in silica using sol-gel method. The SiO2/Zn2SiO4:Mn nanocomposite was characterized by X-ray diffraction (XRD, transmission electron microscopy (TEM, scanning electron microscopy (SEM and photoluminescence (PL. The nanopowder was crystallized in triclinic b-Zn2SiO4 phase with a particles size varies between 70 nm and 84 nm. The SiO2/b-Zn2SiO4:Mn nanocomposite exhibited a broad yellow emission band at 575 nm under UV excitation light. The dependence of the intensity and energy position of the obtained PL band on measurement temperature and power excitation will be discussed.

  4. Distribution of electron traps in SiO2/HfO2 nMOSFET

    Science.gov (United States)

    Xiao-Hui, Hou; Xue-Feng, Zheng; Ao-Chen, Wang; Ying-Zhe, Wang; Hao-Yu, Wen; Zhi-Jing, Liu; Xiao-Wei, Li; Yin-He, Wu

    2016-05-01

    In this paper, the principle of discharge-based pulsed I-V technique is introduced. By using it, the energy and spatial distributions of electron traps within the 4-nm HfO2 layer have been extracted. Two peaks are observed, which are located at ΔE ˜ -1.0 eV and -1.43 eV, respectively. It is found that the former one is close to the SiO2/HfO2 interface and the latter one is close to the gate electrode. It is also observed that the maximum discharge time has little effect on the energy distribution. Finally, the impact of electrical stress on the HfO2 layer is also studied. During stress, no new electron traps and interface states are generated. Meanwhile, the electrical stress also has no impact on the energy and spatial distribution of as-grown traps. The results provide valuable information for theoretical modeling establishment, material assessment, and reliability improvement for advanced semiconductor devices. Project supported by the National Natural Science Foundation of China (Grant Nos. 61334002, 61106106, and 61474091), the New Experiment Development Funds for Xidian University, China (Grant No. SY1434), and the Scientific Research Foundation for the Returned Overseas Chinese Scholars, State Education Ministry, China (Grant No. JY0600132501).

  5. In vitro and in vivo genotoxicity investigations of differently sized amorphous SiO2 nanomaterials.

    Science.gov (United States)

    Maser, Elena; Schulz, Markus; Sauer, Ursula G; Wiemann, Martin; Ma-Hock, Lan; Wohlleben, Wendel; Hartwig, Andrea; Landsiedel, Robert

    2015-12-01

    In vitro and in vivo genotoxic effects of differently sized amorphous SiO2 nanomaterials were investigated. In the alkaline Comet assay (with V79 cells), non-cytotoxic concentrations of 300 and 100-300μg/mL 15nm-SiO2 and 55nm-SiO2, respectively, relevant (at least 2-fold relative to the negative control) DNA damage. In the Alkaline unwinding assay (with V79 cells), only 15nm-SiO2 significantly increased DNA strand breaks (and only at 100μg/mL), whereas neither nanomaterial (up to 300μg/mL) increased Fpg (Formamidopyrimidine DNA glycosylase)-sensitive sites reflecting oxidative DNA base modifications. In the Comet assay using rat precision-cut lung slices, 15nm-SiO2 and 55nm-SiO2 induced significant DNA damage at ≥100μg/mL. In the Alkaline unwinding assay (with A549 cells), 30nm-SiO2 and 55nm-SiO2 (with larger primary particle size (PPS)) induced significant increases in DNA strand breaks at ≥50μg/mL, whereas 9nm-SiO2 and 15nm-SiO2 (with smaller PPS) induced significant DNA damage at higher concentrations. These two amorphous SiO2 also increased Fpg-sensitive sites (significant at 100μg/mL). In vivo, within 3 days after single intratracheal instillation of 360μg, neither 15nm-SiO2 nor 55nm-SiO2 caused genotoxic effects in the rat lung or in the bone marrow. However, pulmonary inflammation was observed in both test groups with findings being more pronounced upon treatment with 15nm-SiO2 than with 55nm-SiO2. Taken together, the study shows that colloidal amorphous SiO2 with different particle sizes may induce genotoxic effects in lung cells in vitro at comparatively high concentrations. However, the same materials elicited no genotoxic effects in the rat lung even though pronounced pulmonary inflammation evolved. This may be explained by the fact that a considerably lower dose reached the target cells in vivo than in vitro. Additionally, the different time points of investigation may provide more time for DNA damage repair after instillation. Copyright

  6. Interface reactions at TiN/HfSiON gate stacks: Dependence on the electrode structure and deposition method

    Directory of Open Access Journals (Sweden)

    Shiniti Yoshida et al

    2007-01-01

    Full Text Available We systematically investigated intrinsic and extrinsic thermal reactions at TiN/HfSiON gate stacks. The formation of an ultrathin TiO2 interlayer was found to be an intrinsic reaction at the metal/insulator interface, but growth of SiO2 underlayers between HfSiON and Si substrates, which determines the electrical thickness of metal-oxide-semiconductor (MOS devices, depends on the structure and deposition method of the gate electrodes. Physical vapor deposition (PVD grown TiN electrodes covered with W overlayers exhibited excellent thermal stability at up to 1000 °C. Formation of ultrathin TiO2 interlayers reduced gate leakage current (Ig, and growth of the oxide underlayer was suppressed by less than a few angstroms even for 1000 °C annealing. In contrast, we found that halogen impurities within CVD-grown metal electrodes enhance interface SiO2 growth, resulting in deterioration of equivalent oxide thickness (EOT versus Ig characteristics of the gate stacks.

  7. Phonon spectra in SiO2 glasses

    International Nuclear Information System (INIS)

    Perez R, J.F.; Jimenez S, S.; Gonzalez H, J.; Vorobiev, Y.V.; Hernandez L, M.A.; Parga T, J.R.

    1999-01-01

    Phonon spectra in SiO 2 sol-gel made glasses annealed under different conditions are investigated using infrared absorption and Raman scattering. These data are compared with those obtained in commercial optical-quality quartz. All the materials exhibit the same phonon bands, the exact position and the intensity depend on the measuring technique and on the sample preparation method. The phonon spectra in this material are interpreted on the basis of a simple quasi-linear description of elastic waves in an O-Si-O chain. It is shown that the main features observed in the range 400-1400 cm -1 can be predicted using a quasi-linear chain model in which the band at 1070 cm -1 is assigned to the longitudinal optical waves in the O-Si-O chain with the smallest possible wavelength at the Brillouin zone boundary, the band located around 450 cm -1 is assigned to the transversal optical waves and the band at 800 cm -1 to the longitudinal acoustical waves with the same wavelength. The degree of structural disorder can be also deduced within the framework of the proposed model. (Author)

  8. Scintillator based on SiO2-aerogel

    International Nuclear Information System (INIS)

    Boyko, I.R.; Ignatenko, M.A.; Esenak, K.; Kuhta, L.; Ruzicka, J.; Fainor, V.

    1995-01-01

    For increasing the light output of SiO 2 -aerogel two aerogel samples were doped with the wavelength shifter POPOP. As a result a scintillator with intermediate density between the gas and the solid state has been produced. The light pulse shapes of the both samples are well approximated by a sum of two exponents with the decay times 1.4±0.1 ns (58% of total light output) and 5.2±0.4 ns (42%). Under irradiation of 5.5 MeV α-particles the light output of the sample with smaller wavelength shifter concentration was 30% and that of the sample with larger concentration was 8% of the light output of a plastic scintillator (polysterene, 2% paraterphenil, 0.2% POPOP). The obtained data indicate that the α/β ratio for both samples is close to 1. This material can be used in experiments where the amount of substance in the way of particles to be detected is a critical factor. (orig.)

  9. H2O and O2 molecules in amorphous SiO2: Defect formation and annihilation mechanisms

    International Nuclear Information System (INIS)

    Bakos, T.; Rashkeev, S.N.; Pantelides, S.T.

    2004-01-01

    Interstitial water and oxygen molecules are ubiquitous impurities and participate in various defect formation processes in thermally grown SiO 2 films and synthetic silica glass. Using results of first-principles calculations we report the types of defects (including different possible charge states) that H 2 O and O 2 molecules may form in bulk amorphous SiO 2 . We calculate their formation energies and, in the most interesting cases, the energy barriers in order to map out the most likely defect formation scenarios. In particular, we show that water molecules may form double silanol groups (Si-OH) as well as H 3 O + and OH - ions at a low energy cost with a barrier of about 1.5 eV. The formation energies of other defects emanating from H 2 O interstitials are, however, too high to be thermally activated. We found that O 2 molecules may form ozonyl (Si-O-O-O-Si) linkages with an energy barrier of ∼2.4 eV. An explanation for the oxygen isotope exchange observed in thin SiO 2 films near the Si-SiO 2 and SiO 2 -vacuum interfaces is suggested based on the energy barrier for ozonyl formation being commensurate with the O 2 diffusion barrier close to the Si/SiO 2 interface and the O 2 incorporation energy from vacuum. We also explain the different creation rates of E ' centers in wet and dry oxides by studying the annihilation mechanism of neutral and charged oxygen vacancies

  10. In vitro cytotoxicity of SiO2 or ZnO nanoparticles with different sizes and surface charges on U373MG human glioblastoma cells

    Directory of Open Access Journals (Sweden)

    Kim JE

    2014-12-01

    Full Text Available Jung-Eun Kim,1,* Hyejin Kim,1,* Seong Soo A An,2 Eun Ho Maeng,3 Meyoung-Kon Kim,4 Yoon-Jae Song1 1Department of Life Science, 2Department of Bionano Technology, Gachon University, Seongnam-Si, South Korea; 3Korea Testing and Research Institute, Seoul, South Korea; 4Department of Biochemistry and Molecular Biology, Korea University Medical School and College, Seoul, South Korea *These authors contributed equally to this work Abstract: Silicon dioxide (SiO2 and zinc oxide (ZnO nanoparticles are widely used in various applications, raising issues regarding the possible adverse effects of these metal oxide nanoparticles on human cells. In this study, we determined the cytotoxic effects of differently charged SiO2 and ZnO nanoparticles, with mean sizes of either 100 or 20 nm, on the U373MG human glioblastoma cell line. The overall cytotoxicity of ZnO nanoparticles against U373MG cells was significantly higher than that of SiO2 nanoparticles. Neither the size nor the surface charge of the ZnO nanoparticles affected their cytotoxicity against U373MG cells. The 20 nm SiO2 nanoparticles were more toxic than the 100 nm nanoparticles against U373MG cells, but the surface charge had little or no effect on their cytotoxicity. Both SiO2 and ZnO nanoparticles activated caspase-3 and induced DNA fragmentation in U373MG cells, suggesting the induction of apoptosis. Thus, SiO2 and ZnO nanoparticles appear to exert cytotoxic effects against U373MG cells, possibly via apoptosis. Keyword: apoptosis

  11. Structural aspects of B2O3-substituted (PbO)0.5(SiO2)0.5 glasses

    International Nuclear Information System (INIS)

    Sudarsan, V.; Kulshreshtha, S.K.; Shrikhande, V.K.; Kothiyal, G.P.

    2002-01-01

    Lead borosilicate glasses having general formulae (PbO) 0.5-x (SiO 2 ) 0.5 (B 2 O 3 ) x with 0.0≤x≤0.4 and (PbO) 0.5 (SiO 2 ) 0.5-y (B 2 O 3 ) y with 0.0≤y≤0.5 have been prepared by a conventional melt-quench method and characterized by 29 Si, 11 B magic angle spinning (MAS) NMR techniques and infrared spectroscopy, as regards their structural features. From 29 Si NMR results, it has been inferred that with increasing concentration of boron oxide, (PbO) 0.5-x (SiO 2 ) 0.5 (B 2 O 3 )x glasses exhibit a systematic increase in the number of Q 4 structural units of Si at the expense of Q 2 structural units, along with the formation of Si-O-B linkages. On the other hand, for (PbO) 0.5 (SiO 2 ) 0.5-y (B 2 O 3 ) y glasses, there is no direct interaction between SiO 2 and B 2 O 3 in the glass network, as revealed by the 29 Si MAS NMR studies. Boron exists in both trigonal and tetrahedral configurations for these two series of glasses and for the (PbO) 0.5 (SiO 2 ) 0.5-y (B 2 O 3 ) y series of glasses; the relative concentration of these two structural units remains almost constant with increasing B 2 O 3 concentration. In contrast, for (PbO) 0.5-x (SiO 2 ) 0.5 (B 2 O 3 ) x glasses, there is a slight increase in the number of BO 3 structural units above x = 0.2, as there is a competition between SiO 2 and B 2 O 3 for interaction with Pb 2+ , thereby leading to the formation of BO 3 structural units. For both series of glasses, the thermal expansion coefficient is found to decrease with increasing B 2 O 3 concentration, the effect being more pronounced for the (PbO) 0.5-x (SiO 2 ) 0.5 (B 2 O 3 ) x series of glasses due to the increased concentration of Q 4 structural units of silicon and better cross-linking as a result of the formation of Si-O-B-type linkages. (author)

  12. Inorganic proton conducting electrolyte coupled oxide-based dendritic transistors for synaptic electronics.

    Science.gov (United States)

    Wan, Chang Jin; Zhu, Li Qiang; Zhou, Ju Mei; Shi, Yi; Wan, Qing

    2014-05-07

    Ionic/electronic hybrid devices with synaptic functions are considered to be the essential building blocks for neuromorphic systems and brain-inspired computing. Here, artificial synapses based on indium-zinc-oxide (IZO) transistors gated by nanogranular SiO2 proton-conducting electrolyte films are fabricated on glass substrates. Spike-timing dependent plasticity and paired-pulse facilitation are successfully mimicked in an individual bottom-gate transistor. Most importantly, dynamic logic and dendritic integration established by spatiotemporally correlated spikes are also mimicked in dendritic transistors with two in-plane gates as the presynaptic input terminals.

  13. Improvements in gate-dielectric characteristics of nitrided oxides prepared by rapid thermal processing. Kyusoku kanetsu chikka sankamaku ni yoru gate zetsuenmaku tokusei no kojo

    Energy Technology Data Exchange (ETDEWEB)

    Hori, T. (Matsushita Electric Industral Co. Ltd., Osaka (Japan))

    1991-11-10

    This paper indicates that, in improving gate-dielectric characteristics of MOSFET, a nitriding treatment (light nitridation) using the rapid thermal processing (RTP) is superior to a treatment using resistance heating furnace (heavy nitridation) in terms of the controllability of the teatment processes. Although a nitridation treatment alone will not be able to achive simultaneously the suppression of the interface level generation in the gate insulation films, and the reduction of electron capturing, the paper claims that both requirements can be met if nitrided oxide films generated by the nitridation are re-oxidezed by the RTP. It is suggested that when the re-oxidized nitrided oxide films (provided they are re-oxidized after light nitridation) are used for the gate insulation films in place of the conventional SiO{sub 2} films, the various characteristics representing the performance and reliability of micronized MOS devices (subthreshold characteristics, characteristics of insulation break-down with time, etc.) in general can be equivalent or better. 18 refs., 7 figs., 2 tabs.

  14. Photoluminescent characteristics of ion beam synthesized Ge nanoparticles in thermally grown SiO2 films

    International Nuclear Information System (INIS)

    Yu, C.F.; Chao, D.S.; Chen, Y.-F.; Liang, J.H.

    2013-01-01

    Prospects of developing into numerous silicon-based optoelectronic applications have prompted many studies on the optical properties of Ge nanoparticles within a silicon oxide (SiO 2 ) matrix. Even with such abundant studies, the fundamental mechanism underlying the Ge nanoparticle-induced photoluminescence (PL) is still an open question. In order to elucidate the mechanism, we dedicate this study to investigating the correlation between the PL properties and microstructure of the Ge nanoparticles synthesized in thermally grown SiO 2 films. Our spectral data show that the peak position, at ∼3.1 eV or 400 nm, of the PL band arising from the Ge nanoparticles was essentially unchanged under different Ge implantation fluences and the temperatures of the following annealing process, whereas the sample preparation parameters modified or even fluctuated (in the case of the annealing temperature) the peak intensity considerably. Given the microscopically observed correlation between the nanoparticle structure and the sample preparation parameters, this phenomenon is consistent with the mechanism in which the oxygen-deficiency-related defects in the Ge/SiO 2 interface act as the major luminescence centers; this mechanism also successfully explains the peak intensity fluctuation with the annealing temperature. Moreover, our FTIR data indicate the formation of GeO x upon ion implantation. Since decreasing of the oxygen-related defects by the GeO x formation is expected to be correlated with the annealing temperature, presence of the GeO x renders further experimental support to the oxygen defect mechanism. This understanding may assist the designing of the manufacturing process to optimize the Ge nanoparticle-based PL materials for different technological applications

  15. Single electron transistors with hydrogen treatment of ALD SiO2 in nanoscale metal-insulator-metal tunnel junctions

    Science.gov (United States)

    Karbasian, Golnaz; McConnell, Michael S.; Orlov, Alexei O.; Nazarov, Alexei N.; Snider, Gregory L.

    2017-05-01

    Over the past five years, fabrication of metal-insulator-metal (MIM) single electron transistors (SET) featuring atomic layer deposition (ALD) of ultrathin tunnel barrier dielectrics (SiO2, Al2O3) has been reported. However, the performance of fabricated devices was significantly compromised by the presence of native metal oxide and problems associated with the nucleation of ALD dielectrics on metal substrates. To overcome the difficulty of dielectric ALD nucleation on metal substrates, we recently developed a fabrication technique in which the native metal oxide naturally forming in the presence of the ALD oxidant precursor is first used to promote the nucleation of ALD dielectrics, and then is chemically reduced by forming gas anneal (FGA) at temperatures near 400 °C. However, despite the elimination of native oxide, low temperature characterization of the devices fabricated using FGA reveals excess ‘switching’ noise of a very large magnitude resulting from charged defects within the junctions. It has been previously reported that remote hydrogen plasma (RHP) treatment of SiO2 thin films effectively eradicates fabrication defects. This work reports a comparative study of Ni-based MIM SET treated with FGA and/or RHP. We show that, using a combination of FGA and RHP treatments, it is possible to obtain MIM junctions free of switching noise and without a detectable contribution of native oxide.

  16. Ordered micro/macro porous K-OMS-2/SiO2 nanocatalysts: Facile synthesis, low cost and high catalytic activity for diesel soot combustion

    Science.gov (United States)

    Yu, Xuehua; Zhao, Zhen; Wei, Yuechang; Liu, Jian

    2017-04-01

    A series of novel oxide catalysts, which contain three-dimensionally ordered macroporous (3DOM) and microporous structure, were firstly designed and successfully synthesized by simple method. In the as-prepared catalysts, 3DOM SiO2 is used as support and microporous K-OMS-2 oxide nanoparticles are supported on the wall of SiO2. 3DOM K-OMS-2/SiO2 oxide catalysts were firstly used in soot particle oxidation reaction and they show very high catalytic activities. The high activities of K-OMS-2/SiO2 oxide catalysts can be assigned to three possible reasons: macroporous effect of 3DOM structure for improving contact between soot and catalyst, microporous effect of K-OMS-2 for adsorption of small gas molecules and interaction of K and Mn for activation of gas molecules. The catalytic activities of catalysts are comparable to or even higher than noble metal catalyst in the medium and high temperature range. For example, the T50 of K-OMS-2/SiO2-50, 328 °C, is much lower than those of Pt/Al2O3 and 3DOM Au/LaFeO3, 464 and 356 °C,respectively. Moreover, catalysts exhibited high catalytic stability. It is attributed to that the K+ ions are introduced into the microporous structure of OMS-2 and stabilized in the catalytic reaction. Meanwhile, the K+ ions play an important role in templating and stabilizing the tunneled framework of OMS-2.

  17. Control of interfacial properties of Pr-oxide/Ge gate stack structure by introduction of nitrogen

    Science.gov (United States)

    Kato, Kimihiko; Kondo, Hiroki; Sakashita, Mitsuo; Nakatsuka, Osamu; Zaima, Shigeaki

    2011-06-01

    We have demonstrated the control of interfacial properties of Pr-oxide/Ge gate stack structure by the introduction of nitrogen. From C- V characteristics of Al/Pr-oxide/Ge 3N 4/Ge MOS capacitors, the interface state density decreases without the change of the accumulation capacitance after annealing. The TEM and TED measurements reveal that the crystallization of Pr-oxide is enhanced with annealing and the columnar structure of cubic-Pr 2O 3 is formed after annealing. From the depth profiles measured using XPS with Ar sputtering for the Pr-oxide/Ge 3N 4/Ge stack structure, the increase in the Ge component is not observed in a Pr-oxide film and near the interface between a Pr-oxide film and a Ge substrate. In addition, the N component segregates near the interface region, amorphous Pr-oxynitride (PrON) is formed at the interface. As a result, Pr-oxide/PrON/Ge stacked structure without the Ge-oxynitride interlayer is formed.

  18. Assembly of Fe3O4 nanoparticles on SiO2 monodisperse spheres

    Indian Academy of Sciences (India)

    Assembly of Fe3O4 nanoparticles on SiO2 monodisperse spheres. K C BARICK and D BAHADUR*. Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology Bombay,. Mumbai 400 076, India. Abstract. The assembly of superparamagnetic Fe3O4 nanoparticles on submicroscopic SiO2 ...

  19. Field emission properties of SiO2-wrapped CNT field emitter

    Science.gov (United States)

    Lim, Yu Dian; Hu, Liangxing; Xia, Xin; Ali, Zishan; Wang, Shaomeng; Tay, Beng Kang; Aditya, Sheel; Miao, Jianmin

    2018-01-01

    Carbon nanotubes (CNTs) exhibit unstable field emission (FE) behavior with low reliability due to uneven heights of as-grown CNTs. It has been reported that a mechanically polished SiO2-wrapped CNT field emitter gives consistent FE performance due to its uniform CNT heights. However, there are still a lack of studies on the comparison between the FE properties of freestanding and SiO2-wrapped CNTs. In this study, we have performed a comparative study on the FE properties of freestanding and SiO2-wrapped CNT field emitters. From the FE measurements, freestanding CNT field emitter requires lower applied voltage of 5.5 V μm‑1 to achieve FE current density of 22 mA cm‑2 whereas SiO2-wrapped field emitter requires 8.5 V μm‑1 to achieve the same current density. This can be attributed to the lower CNT tip electric field of CNTs embedded in SiO2, as obtained from the electric field simulation. Nevertheless, SiO2-wrapped CNTs show higher consistency in FE current than freestanding CNTs. Under repeated FE measurement, SiO2-wrapped CNT field emitter achieves consistent FE behavior from the 1st voltage sweep, whereas freestanding field emitter only achieved consistent FE performance after 3rd voltage sweep. At the same time, SiO2-wrapped CNTs exhibit better emission stability than freestanding CNTs over 4000 s continuous emission.

  20. Assembly of Fe3O4 nanoparticles on SiO2 monodisperse spheres

    Indian Academy of Sciences (India)

    Abstract. The assembly of superparamagnetic Fe3O4 nanoparticles on submicroscopic SiO2 spheres have been prepared by an in situ reaction using different molar ratios of Fe3+/Fe2+ (50–200%). It has been observed that morphology of the assembly and properties of these hybrid materials composed of SiO2 as core ...

  1. Ultrathin silicon dioxide layers with a low leakage current density formed by chemical oxidation of Si

    Science.gov (United States)

    Asuha,; Kobayashi, Takuya; Maida, Osamu; Inoue, Morio; Takahashi, Masao; Todokoro, Yoshihiro; Kobayashi, Hikaru

    2002-10-01

    Chemical oxidation of Si by use of azeotrope of nitric acid and water can form 1.4-nm-thick silicon dioxide layers with a leakage current density as low as those of thermally grown SiO2 layers. The capacitance-voltage (C-V) curves for these ultrathin chemical SiO2 layers have been measured due to the low leakage current density. The leakage current density is further decreased to approx1/5 (cf. 0.4 A/cm2 at the forward gate bias of 1 V) by post-metallization annealing at 200 degC in hydrogen. Photoelectron spectroscopy and C-V measurements show that this decrease results from (i) increase in the energy discontinuity at the Si/SiO2 interface, and (ii) elimination of Si/SiO2 interface states and SiO2 gap states.

  2. High-k perovskite gate oxide BaHfO3

    Science.gov (United States)

    Kim, Young Mo; Park, Chulkwon; Ha, Taewoo; Kim, Useong; Kim, Namwook; Shin, Juyeon; Kim, Youjung; Yu, Jaejun; Kim, Jae Hoon; Char, Kookrin

    2017-01-01

    We have investigated epitaxial BaHfO3 as a high-k perovskite dielectric. From x-ray diffraction measurement, we confirmed the epitaxial growth of BaHfO3 on BaSnO3 and MgO. We measured optical and dielectric properties of the BaHfO3 gate insulator; the optical bandgap, the dielectric constant, and the breakdown field. Furthermore, we fabricated a perovskite heterostructure field effect transistor using epitaxial BaHfO3 as a gate insulator and La-doped BaSnO3 as a channel layer on SrTiO3 substrate. To reduce the threading dislocations and enhance the electrical properties of the channel, an undoped BaSnO3 buffer layer was grown on SrTiO3 substrates before the channel layer deposition. The device exhibited a field effect mobility value of 52.7 cm2 V-1 s-1, a Ion/Ioff ratio higher than 107, and a subthreshold swing value of 0.80 V dec-1. We compare the device performances with those of other field effect transistors based on BaSnO3 channels and different gate oxides.

  3. High-k perovskite gate oxide BaHfO3

    Directory of Open Access Journals (Sweden)

    Young Mo Kim

    2017-01-01

    Full Text Available We have investigated epitaxial BaHfO3 as a high-k perovskite dielectric. From x-ray diffraction measurement, we confirmed the epitaxial growth of BaHfO3 on BaSnO3 and MgO. We measured optical and dielectric properties of the BaHfO3 gate insulator; the optical bandgap, the dielectric constant, and the breakdown field. Furthermore, we fabricated a perovskite heterostructure field effect transistor using epitaxial BaHfO3 as a gate insulator and La-doped BaSnO3 as a channel layer on SrTiO3 substrate. To reduce the threading dislocations and enhance the electrical properties of the channel, an undoped BaSnO3 buffer layer was grown on SrTiO3 substrates before the channel layer deposition. The device exhibited a field effect mobility value of 52.7 cm2 V−1 s−1, a Ion/Ioff ratio higher than 107, and a subthreshold swing value of 0.80 V dec−1. We compare the device performances with those of other field effect transistors based on BaSnO3 channels and different gate oxides.

  4. Microporous SiO2-based solid electrolyte with improved polarization response for 0.8 V transparent thin-film transistors

    International Nuclear Information System (INIS)

    Sun Jia; Jiang Jie; Lu Aixia; Wan Qing

    2010-01-01

    The polarization mechanism of a microporous SiO 2 -based solid electrolyte is developed and three polarizations (electric double layer formation, ionic relaxation and dipole relaxation) are identified. The polarization response of the microporous SiO 2 -based solid electrolyte is optimized by tuning the deposition temperature and the improved specific capacitance is 1 μF cm -2 at 1 kHz and remains above 0.6 μF cm -2 even at 10 kHz. Ultralow-voltage transparent In-Zn-O thin-film transistors (TFTs) gated by such dielectrics are fabricated at low temperatures. The field-effect mobility, current on/off ratio and subthreshold swing are estimated to be 46.2 cm 2 V -1 s -1 , ∼10 6 and 69 mV/decade, respectively. Such TFTs hold promise for portable electronic applications.

  5. SEMICONDUCTOR DEVICES: Structural and electrical characteristics of lanthanum oxide gate dielectric film on GaAs pHEMT technology

    Science.gov (United States)

    Chia-Song, Wu; Hsing-Chung, Liu

    2009-11-01

    This paper investigates the feasibility of using a lanthanum oxide thin film (La2O3) with a high dielectric constant as a gate dielectric on GaAs pHEMTs to reduce gate leakage current and improve the gate to drain breakdown voltage relative to the conventional GaAs pHEMT. An E/D mode pHEMT in a single chip was realized by selecting the appropriate La2O3 thickness. The thin La2O3 film was characterized: its chemical composition and crystalline structure were determined by X-ray photoelectron spectroscopy and X-ray diffraction, respectively. La2O3 exhibited good thermal stability after post-deposition annealing at 200, 400 and 600 °C because of its high binding-energy (835.6 eV). Experimental results clearly demonstrated that the La2O3 thin film was thermally stable. The DC and RF characteristics of Pt/La2O3/Ti/Au gate and conventional Pt/Ti/Au gate pHEMTs were examined. The measurements indicated that the transistor with the Pt/La2O3/Ti/Au gate had a higher breakdown voltage and lower gate leakage current. Accordingly, the La2O3 thin film is a potential high-k material for use as a gate dielectric to improve electrical performance and the thermal effect in high-power applications.

  6. Síntese e caracterização de nanocompósitos Ni: SiO2 processados na forma de filmes finos Synthesis and characterization of Ni: SiO2 nanocomposites processed as thin films

    Directory of Open Access Journals (Sweden)

    Paulo Sérgio Gouveia

    2005-10-01

    Full Text Available We have produced nanocomposite films of Ni:SiO2 by an alternative polymeric precursor route. Films, with thickness of ~ 1000 nm, were characterized by several techniques including X-ray diffraction, scanning electron microscopy, atomic force microscopy, flame absorption atomic spectrometry, and dc magnetization. Results from the microstructural characterizations indicated that metallic Ni-nanoparticles with average diameter of ~ 3 nm are homogeneously distributed in an amorphous SiO2 matrix. Magnetization measurements revealed a blocking temperature T B ~ 7 K for the most diluted sample and the absence of an exchange bias suggesting that Ni nanoparticles are free from an oxide layer.

  7. Magnetic nanoparticles induced dielectric enhancement in (La, Gd)2O3: SiO2 composite systems

    Science.gov (United States)

    Kao, T. H.; Mukherjee, S.; Yang, H. D.

    2013-11-01

    Magnetic Gd2O3 and non-magnetic La2O3 nanoparticles (NPs) have been synthesized together with different doping concentrations in SiO2 matrix via sol-gel route calcination at 700 °C and above. Properly annealed NP-glass composite systems show enhancement of dielectric constant and magnetodielectric effect (MDE) near room temperature, depending on superparamagnetic NPs concentrations. From application point of view, the enhancement of dielectric constant along with MDE can be achieved by tuning the NPs size through varying calcination temperature and/or increasing the doping concentration of magnetic rare earth oxide.

  8. The effects of irradiation and proton implantation on the density of mobile protons in SiO2 films

    International Nuclear Information System (INIS)

    Vanheusden, K.

    1998-04-01

    Proton implantation into the buried oxide of Si/SiO 2 /Si structures does not introduce mobile protons. The cross section for capture of radiation-induced electrons by mobile protons is two orders of magnitude smaller than for electron capture by trapped holes. The data provide new insights into the atomic mechanisms governing the generation and radiation tolerance of mobile protons in SiO 2 . This can lead to improved techniques for production and radiation hardening of radiation tolerant memory devices

  9. Synthesis of Mo–Fe3O4@SiO2@P4VP core–shell–shell structured magnetic microspheres for alkene epoxidation reactions

    International Nuclear Information System (INIS)

    Huang, Xiubing; Guo, Wanchun; Wang, Ge; Yang, Mu; Wang, Qian; Zhang, Xinxin; Feng, Yanhui; Shi, Zhan; Li, Chunguang

    2012-01-01

    Molybdenum complexes immobilized on core–shell–shell structured Fe 3 O 4 @SiO 2 @poly(4-vinylpyridine) microspheres have been successfully fabricated by grafting [3-(methacryloyloxy)propyl]trimethoxysilane on Fe 3 O 4 @SiO 2 followed by seeded emulsion polymerization of 4-vinylpyridine monomers. The synthesized samples were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), field-emission scanning electron microscopy (FESEM), x-ray photoelectron spectroscopy (XPS), Fourier-transform infrared spectra (FT-IR) and magnetometer. Their catalytic property was investigated by epoxidation of alkenes, using environmentally friendly H 2 O 2 and ethanol as oxidant and solvent, respectively. The results show that Mo–Fe 3 O 4 @SiO 2 @P4VP catalyst possesses high conversion (99.0%) and selectivity (99.0%) in the epoxidation of cis-cyclooctene at 60 °C for 24 h, and the catalyst can be recovered using a magnet and still shows high conversion (95.0%) and selectivity (99.0%) after being recycled three times. -- Highlights: ► Core–shell–shell structured Mo–Fe 3 O 4 @SiO 2 @P4VP microspheres were fabricated. ► The catalyst shows high activity in the epoxidation of alkenes. ► Environmentally friendly H 2 O 2 and ethanol are used as oxidant and solvent. ► The catalyst can be quickly magnetically recovered and maintains high activity.

  10. Hierarchical Cd4SiS6/SiO2 Heterostructure Nanowire Arrays.

    Science.gov (United States)

    Liu, Jian; Wang, Chunrui; Xie, Qingqing; Cai, Junsheng; Zhang, Jing

    2009-10-29

    Novel hierarchical Cd4SiS6/SiO2 based heterostructure nanowire arrays were fabricated on silicon substrates by a one-step thermal evaporation of CdS powder. The as-grown products were characterized using scanning electron microscopy, X-ray diffraction, and transmission electron microscopy. Studies reveal that a typical hierarchical Cd4SiS6/SiO2 heterostructure nanowire is composed of a single crystalline Cd4SiS6 nanowire core sheathed with amorphous SiO2 sheath. Furthermore, secondary nanostructures of SiO2 nanowires are highly dense grown on the primary Cd4SiS6 core-SiO2 sheath nanowires and formed hierarchical Cd4SiS6/SiO2 based heterostructure nanowire arrays which stand vertically on silicon substrates. The possible growth mechanism of hierarchical Cd4SiS6/SiO2 heterostructure nanowire arrays is proposed. The optical properties of hierarchical Cd4SiS6/SiO2 heterostructure nanowire arrays are investigated using Raman and Photoluminescence spectroscopy.

  11. Preparation and Characterization of SiO2/SiCN Core-shell Ceramic Microspheres

    Directory of Open Access Journals (Sweden)

    ZHANG Hai-yuan

    2017-05-01

    Full Text Available The SiO2/PSN core-shell microspheres were prepared via an emulsion reaction combined with the polymer-derived ceramics (PDCs method using polysilazane (PSN in situ polymerization on the surface of SiO2 modified by silane coupling agents MPS, followed by pyrolysis process to obtain SiO2/SiCN core-shell ceramic microspheres. The effects of raw mass ratio, curing time and pyrolysis temperature on the formation and the morphology of core-shell microspheres were studied. The morphology, chemical composition and phase transformation were characterized by SEM, EDS, TEM, FT-IR and XRD. The results show that after reaction for 4h at 200℃, SiO2 completely coated PSN forms a core-shell microsphere with rough surface when the mass ratio of SiO2 and PSN is 1:4; when pyrolysis temperature is at 800-1200℃, amorphous SiO2/SiCN core-shell ceramic microspheres are prepared; at 1400℃, the amorphous phase partially crystallizes to produce SiO2, SiC and Si3N4 phase.

  12. Hierarchical Cd4SiS6/SiO2 Heterostructure Nanowire Arrays

    Directory of Open Access Journals (Sweden)

    Liu Jian

    2009-01-01

    Full Text Available Abstract Novel hierarchical Cd4SiS6/SiO2 based heterostructure nanowire arrays were fabricated on silicon substrates by a one-step thermal evaporation of CdS powder. The as-grown products were characterized using scanning electron microscopy, X-ray diffraction, and transmission electron microscopy. Studies reveal that a typical hierarchical Cd4SiS6/SiO2 heterostructure nanowire is composed of a single crystalline Cd4SiS6 nanowire core sheathed with amorphous SiO2 sheath. Furthermore, secondary nanostructures of SiO2 nanowires are highly dense grown on the primary Cd4SiS6 core-SiO2 sheath nanowires and formed hierarchical Cd4SiS6/SiO2 based heterostructure nanowire arrays which stand vertically on silicon substrates. The possible growth mechanism of hierarchical Cd4SiS6/SiO2 heterostructure nanowire arrays is proposed. The optical properties of hierarchical Cd4SiS6/SiO2 heterostructure nanowire arrays are investigated using Raman and Photoluminescence spectroscopy.

  13. Enhanced antioxidation and microwave absorbing properties of SiO2-coated flaky carbonyl iron particles

    Science.gov (United States)

    Zhou, Yingying; Xie, Hui; Zhou, Wancheng; Ren, Zhaowen

    2018-01-01

    SiO2 was successfully coated on the surface of flaky carbonyl iron particles using a chemical bath deposition method in the presence of 3-aminopropyl triethoxysilane (APTES). The morphologies, composition, valence states of elements, as well as antioxidation and electromagnetic properties of the samples were characterized by scanning electron microscope (SEM), energy dispersive spectrometer (EDS), X-ray photoelectron spectroscopy (XPS), thermogravimetric (TG) and microwave network analyzer. TG curve shows the obvious weight gain of carbonyl iron was deferred to 360 °C after SiO2-coated, which can be ascribed to the exits of SiO2 overlayer. Compared with the raw carbonyl iron, SiO2-coated sample shows good wave absorption performance due to its impedance matching. The electromagnetic properties of raw and SiO2-coated carbonyl iron particles were characterized in X band before and after heat treatment at 250 °C for 10 h. It was established that SiO2-coated carbonyl iron demonstrate good thermal stability, indicating SiO2-coating is useful in the usage of microwave absorbers operating at temperature up to 250 °C.

  14. Effect of SiO2 addition and gamma irradiation on the lithium borate glasses

    Science.gov (United States)

    Raut, A. P.; Deshpande, V. K.

    2018-01-01

    The physical properties like density, glass transition temperature (Tg), and ionic conductivity of lithium borate (LB) glasses with SiO2 addition were measured before and after gamma irradiation. Remarkable changes in properties have been obtained in the physical properties of LB glasses with SiO2 addition and after gamma irradiation. The increase in density and glass transition temperature of LB glasses with SiO2 addition has been explained with the help of increase in density of cross linking due to SiO4 tetrahedra formation. The increase in ionic conductivity with SiO2 addition was explained with the help of ‘mixed glass former effect’. The increase in density and Tg of LB glasses with SiO2 addition after gamma irradiation has been attributed to fragmentation of bigger ring structure into smaller rings, which increases the density of cross linking and hence compaction. The exposure of gamma irradiation has lead to decrease in ionic conductivity of LB glasses with SiO2 addition. The atomic displacement caused by gamma irradiation resulted in filling of interstices and decrease in trapping sites. This explains the obtained decrease in ionic conductivity after gamma irradiation of glasses. The obtained results of effect of SiO2 addition and gamma irradiation on the density, Tg and ionic conductivity has been supported by FTIR results.

  15. Cytotoxicity and effect on GJIC of SiO2 nanoparticles in HL-7702 cells

    International Nuclear Information System (INIS)

    Pan Tao; Jin Minghua; Liu Xiaomei; Du Zhongjun; Zhou Xianqing; Huang Peili; Sun Zhiwei

    2013-01-01

    Objective: To study the cytotoxicity and effect on gap junction intracellular communication (GJIC) of SiO 2 nanoparticles in HL-7702 cells, and to provide experimental basis for toxicity assessment and the security applications of SiO 2 nanoparticles. Methods: Transmission electron microscope (TEM) was used to characterize two kinds of SiO 2 nanoparticles, verifying their size, dispersion and shape; dynamic light scattering (DLS) method was used to analyze the water dispersion and culture medium dispersion of the SiO 2 nanoparticles; MTT assay was carried out to examine the cytotoxicities of the two sizes SiO 2 nanoparticles on the cells; lactate dehydrogenase (LDH) release assay was performed to examine the integrity nano of the cell membrane; Scrape-loading and dye transfer assay was performed to examine the effect of SiO 2 nanoparticles on GJIC. Results: Based on the result of TEM, two kinds of SiO 2 nanoparticles were spherically shaped, uniformly sized and sporadically dispersed; the statistical analysis results showed the diameters of the two nanoparticles were (447.60±20.78) nm and (67.42±5.69) nm, respectively, thus they could be categorized as submicron scale and nano scale. The DLS method results manifested that the hydration nanoparticle sizes of the two SiO 2 nanoparticles were (684.37±18.76) nm, (128.31±7.64) nm in high purity water and (697.02±19.57) nm, (133.74±8.97) nm in RPMI-1640 solution, all the two nanoparticles were well dispersed without aggregation. MTT assay indicated that 24 h after treatment of SiO 2 nanoparticles, the cell viabilities were affected by both the size and the dose of the SiO 2 nanoparticles; the higher the dose was, the less viability the cells exhibited. Moreover, the nano scale particles inflicted more damage to the cells. LDH release assay indicated that the SiO 2 particles could also damage the cell membrane in a dose-dependent and size-dependent way. Scrape-loading and dye transfer assay indicated that the nano scale particles could cause GJIC inhibition in a dose-dependent way; and when at the same dose, the nanoparticles could cause a more obvious inhibition of GJIC than the submicron particles. Conclusion: SiO 2 nanoparticles have cytotoxicity on HL-7702 cells, and would cause GJIC inhibition. (authors)

  16. Hierarchical Cd4SiS6/SiO2 Heterostructure Nanowire Arrays

    OpenAIRE

    Liu, Jian; Wang, Chunrui; Xie, Qingqing; Cai, Junsheng; Zhang, Jing

    2009-01-01

    Abstract Novel hierarchical Cd4SiS6/SiO2 based heterostructure nanowire arrays were fabricated on silicon substrates by a one-step thermal evaporation of CdS powder. The as-grown products were characterized using scanning electron microscopy, X-ray diffraction, and transmission electron microscopy. Studies reveal that a typical hierarchical Cd4SiS6/SiO2 heterostructure nanowire is composed of a single crystalline Cd4SiS6 nanowire core sheathed with amorphous SiO2 sheath. Furthermore, secondar...

  17. Facile synthesis of microporous SiO2/triangular Ag composite nanostructures for photocatalysis

    Science.gov (United States)

    Sirohi, Sidhharth; Singh, Anandpreet; Dagar, Chakit; Saini, Gajender; Pani, Balaram; Nain, Ratyakshi

    2017-11-01

    In this article, we present a novel fabrication of microporous SiO2/triangular Ag nanoparticles for dye (methylene blue) adsorption and plasmon-mediated degradation. Microporous SiO2 nanoparticles with pore size green 26 and curcumin crystalline. Amine-functionalized microporous SiO2/triangular Ag nanostructures were used for plasmon-mediated photocatalysis of methylene blue. The experimental results revealed that the large surface area of microporous silica facilitated adsorption of dye. Triangular Ag nanoparticles, due to their better charge carrier generation and enhanced surface plasmon resonance, further enhanced the photocatalysis performance.

  18. Formation of radiative centers in SiO2 by tin high-dose implantation

    International Nuclear Information System (INIS)

    Komarov, F.F.; Parkhomenko, I.N.; Vlasukova, L.A.; Mil'chanin, O.V.; Mokhovikov, M.A.; Wendler, E.; Wesch, W.

    2013-01-01

    The structural transformations in SiO 2 layers implanted with high fluence of Sn ions have been investigated. It has been found that post-implantation annealing results in the β-Sn precipitation as well as the formation of SnO 2 -enriched regions in SiO 2 :Sn matrix. The intensive emission in the range of photon energies 1.5 – 3.5 eV is registered for the implanted and annealed samples. We attribute it to the oxygen deficiency centers created in the SiO 2 :Sn matrix and at the 'nanocluster/SiO 2 ' interfaces. (authors)

  19. Wear Characteristics According of Heat Treatment of Si3N4 with Different Amounts of SiO2 Nano-Colloid

    International Nuclear Information System (INIS)

    Ahn, Seok Hwan; Nam, Ki Woo

    2014-01-01

    This study sintered Si 3 N 4 with different amounts of SiO 2 nano-colloid. The surface of a mirror-polished specimen was coated with SiO 2 nano-colloid, and cracks were healed when the specimen was treated at a temperature of 1273 K for 1 h in air. Wear specimen experiments were conducted after heat treatments for 10 min at 1073, 1273, and 1573 K. The heat-treated surface that was coated with the SiO 2 nano-colloid was slightly rougher than the noncoated surface. The oxidation state of the surface according to the heat treatment temperature showed no correlation with the surface roughness. Moreover, the friction coefficient, wear loss, and bending strength were not related to the surface roughness. Si 3 N 4 exhibited an abrasive wear behavior when SKD11 was used as an opponent material. The friction coefficient was proportional to the wear loss, and the bending strength was inversely proportional to the friction coefficient and wear loss. The friction coefficient and wear loss increased with increasing amounts of the SiO 2 nanocolloid. In addition, the friction coefficient was slightly increased by increasing the heat treatment temperature

  20. Sustainable synthesis of magnetically separable SiO2/Co@Fe2O4 nanocomposite and its catalytic applications for the benzimidazole synthesis

    Science.gov (United States)

    Jithendra Kumara, K. S.; Krishnamurthy, G.; Sunil Kumar, N.; Naik, Nagaraja; Praveen, T. M.

    2018-04-01

    The Co(II) and Fe(III) centres magnetically separable two new mesoporous nanocatalyst were synthesised via chemical synthesis method. The transmission electron microscopic studies (TEM) show that, the particles are spherical shape with mean size of 20 nm. The Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) reveals that SiO2 is coating on the surface of the cobalt ferrate nanoparticle (CoFe2O4). The SiO2 coating is efficiently preventing the aggregated collision of nanoparticles. Magnetic measurements show that diamagnetic character of the SiO2 is unaffected to the coercivity of SiO2 coated CoFe2O4 particles. In addition, these nanoparticles are used as nanocatalyst for high yielding, facile and expeditious synthesis of various functionalized 2-arylbenzimidazoles via one-pot condensation. The cascade including imine formation, cyclization, condensation, and aromatization occurs, without addition of any reducing or oxidizing agents. In all situations, the desired product was synthesised with excellent yield. The shorter reaction time, mild reaction condition, simplicity, non-toxicity, safe reaction and easy workup are the impotent merits of this protocol.

  1. Radiation-induced redistribution of gold in SiO2-Si structures

    International Nuclear Information System (INIS)

    Bolotov, V.V.; Emeksuzyan, V.M.; Spiridonov, V.N.

    1989-01-01

    Gold distribution in SiO 2 -Si structures after diffusion and its redistribution under irradiation by high-energy electrons are studied by DLTS and SIMS methods. It is shown that the concentration of substitutional gold increases at radiation doses of 10 13 to 10 14 cm -2 , which is due to the presence of a previously inactive interstitial component Au I and its dissolution in vacancies. A radiation dose increase results in radiation-induced gettering of gold by the SiO 2 -Si interface with subsequent penetration of gold into SiO 2 . The state of the SiO 2 -Si interface affects the behaviour of gold at irradiation. (author)

  2. Experimental determination of nanofluid specific heat with SiO2 nanoparticles in different base fluids

    Science.gov (United States)

    Akilu, S.; Baheta, A. T.; Sharma, K. V.; Said, M. A.

    2017-09-01

    Nanostructured ceramic materials have recently attracted attention as promising heat transfer fluid additives owing to their outstanding heat storage capacities. In this paper, experimental measurements of the specific heats of SiO2-Glycerol, SiO2-Ethylene Glycol, and SiO2-Glycerol/Ethylene Glycol mixture 60:40 ratio (by mass) nanofluids with different volume concentrations of 1.0-4.0% have been carried out using differential scanning calorimeter at temperatures of 25 °C and 50 °C. Experimental results indicate lower specific heat capacities are found with SiO2 nanofluids compared to their respective base fluids. The specific heat was decreasing with the increase of concentration, and this decrement depends on upon the type of the base fluid. It is observed that temperature has a positive impact on the specific heat capacity. Furthermore, the experimental values were compared with the theoretical model predictions, and a satisfactory agreement was established.

  3. Synthesis of unidirectional structures of SiO2-Ag using Au nanoparticles as nucleation centers

    International Nuclear Information System (INIS)

    Villa S, G.; Mendoza A, D.; Gutierrez W, C.; Perez H, R.

    2008-01-01

    This paper reports a method to synthesize Ag unidirectional structures covered with SiO 2 by sol-gel technique using Au nanoparticles as nucleation centers of the unidirectional structures. In the first phase unidirectional structures of SiO 2 -Ag CI are obtained by sol-gel, using TEOS as a precursor of metallic structures (Ag) and the incorporation of Au nanoparticles as nucleation centers for growth of unidirectional structures. In the second stage, one-way systems are subjected to thermal treatment in H 2 atmosphere for obtain AG 0 particles through mechanisms that diffusion and coalescence of silver to form structures that have a thin cover of SiO 2 . Analysis by scanning electron microscopy, transmission and atomic force microscopy allowed to determine the chemical composition and microstructural properties of unidirectional systems SiO 2 -Ag. (Author)

  4. Interface properties of SiO2/n-GaN metal-insulator-semiconductor structures

    OpenAIRE

    Yoshitaka, Nakano; Takashi, Jimbo

    2002-01-01

    Electrical characterization of SiO2/n-GaN metal-insulator-semiconductor structures fabricated on sapphire substrates was performed by using high-frequency pulsed capacitance-voltage and capacitance-transient techniques. Fast and slow capacitance transients are clearly seen after applying reverse voltages, reflecting thermal emissions of carriers from the SiO2/GaN interface. The temperature dependence of the capacitance-voltage characteristics shows capacitance saturation in deep depletion (>1...

  5. Tetrazoles in the Presence of Nano-TiCl 4 .SiO 2

    African Journals Online (AJOL)

    Nano-TiCl4.SiO2 was found to be an extremely efficient catalyst for the preparation of 5-substituted 1H-tetrazole derivatives. Nano-TiCl4.SiO2 is a solid Lewis-acid was synthesized by the reaction of nano-SiO2 and TiCl4. The structure characterization of this acid was achieved with X-ray diffraction, thermogravimetric ...

  6. Core-exsolved SiO2 Dispersal in the Earth's Mantle

    Science.gov (United States)

    Helffrich, G. R.; Ballmer, M.; Hirose, K.

    2017-12-01

    SiO2 may have been expelled from the core following its formation in the early stages of Earth's accretion and onwards through the present day. On account of SiO2's low density with respect to both the core and the lowermost mantle, we examine the process of SiO2 accumulation at the core-mantle boundary (CMB) and its incorporation into the mantle by buoyant rise. Today, the if SiO2 is 100-10000 times more viscous than lower mantle material, the dimensions of SiO2 diapirs formed by the viscous Rayleigh-Taylor instability at the CMB would cause them to be swept into the mantle as inclusions of 100 m - 10 km diameter. Under early Earth conditions of rapid heat loss after core formation, SiO2 diapirs of 5-80 km diameter could have risen independently of mantle flow to their level of neutral buoyancy in the mantle, trapping them there due to a combination of high viscosity and neutral buoyancy. We examine the SiO2 yield by assuming Si+O saturation at the conditions found at the base of a magma ocean and find that for a range of conditions, dispersed bodies could reach as high as 2 volume percent in shallow parts of the lower mantle, with their abundance decreasing with depth. At such low concentrations, their effect on aggregate seismic wavespeeds would be within the uncertainty of the radial Earth model PREM. However, their presence would be revealed by small-scale scattering in the lower mantle due to the bodies' large velocity contrast. We conclude that the shallow lower mantle (700-1500 km depth) could harbor SiO2 released in early Earth times.

  7. Nano-Ticl 4 .SiO 2 : a Versatile and Efficient Catalyst for Synthesis of ...

    African Journals Online (AJOL)

    Nano-TiCl4.SiO2 has been found to be an extremely efficient catalyst for the preparation of 3,4-dihydropyrimidinones/thiones via three-component reactions of an aldehyde, β-ketoester or β-diketone and urea or thiourea under mild conditions. Nano-TiCl4.SiO2 as a solid Lewis acid has been synthesized by reaction of ...

  8. Calcium phosphate formation on porous sol-gel-derived SiO2 and CaO-P2O5-SiO2 substrates in vitro.

    Science.gov (United States)

    Peltola, T; Jokinen, M; Rahiala, H; Levänen, E; Rosenholm, J B; Kangasniemi, I; Yli-Urpo, A

    1999-01-01

    Sol-gel-derived SiO2 and CaO-P2O5-SiO2 have been shown to be bioactive and bone bonding. In this study bioactive sol-gel-derived SiO2 and CaO-P2O5-SiO2 systems were tested for in in vitro bioactivity. The calcined ceramic monoliths were immersed in a simulated body fluid and analyzed to follow the hydroxyapatite formation on the ceramic surface. Apatite-forming ability was investigated in terms of structural changes by changing the composition and the preparation method. The role of Ca and P dopants in the substrate structure is complicated, and careful characterization is needed. The composition and structure together determine the in vitro bioactivity. The pore structure was analyzed using N2-adsorption/desorption isotherms. The results indicate that a great mesopore volume and a wide mesopore size distribution favor hydroxycarbonate apatite nucleation and a great surface area is not needed. The performed preparation process for silica in a basic environment provides a convenient way to prepare a mesoporous material. Copyright 1999 John Wiley & Sons, Inc.

  9. The influence of fibril composition and dimension on the performance of paper gated oxide transistors

    Science.gov (United States)

    Pereira, L.; Gaspar, D.; Guerin, D.; Delattre, A.; Fortunato, E.; Martins, R.

    2014-03-01

    Paper electronics is a topic of great interest due the possibility of having low-cost, disposable and recyclable electronic devices. The final goal is to make paper itself an active part of such devices. In this work we present new approaches in the selection of tailored paper, aiming to use it simultaneously as substrate and dielectric in oxide based paper field effect transistors (FETs). From the work performed, it was observed that the gate leakage current in paper FETs can be reduced using a dense microfiber/nanofiber cellulose paper as the dielectric. Also, the stability of these devices against changes in relative humidity is improved. On other hand, if the pH of the microfiber/nanofiber cellulose pulp is modified by the addition of HCl, the saturation mobility of the devices increases up to 16 cm2 V-1 s-1, with an ION/IOFF ratio close to 105.

  10. Screen-Printed Photochromic Textiles through New Inks Based on SiO2@naphthopyran Nanoparticles.

    Science.gov (United States)

    Pinto, Tânia V; Costa, Paula; Sousa, Céu M; Sousa, Carlos A D; Pereira, Clara; Silva, Carla J S M; Pereira, Manuel Fernando R; Coelho, Paulo J; Freire, Cristina

    2016-10-26

    Photochromic silica nanoparticles (SiO 2 @NPT), fabricated through the covalent immobilization of silylated naphthopyrans (NPTs) based on 2H-naphtho[1,2-b]pyran (S1, S2) and 3H-naphtho[2,1-b]pyran (S3, S4) or through the direct adsorption of the parent naphthopyrans (1, 3) onto silica nanoparticles (SiO 2 NPs), were successfully incorporated onto cotton fabrics by a screen-printing process. Two aqueous acrylic- (AC-) and polyurethane- (PU-) based inks were used as dispersing media. All textiles exhibited reversible photochromism under UV and solar irradiation, developing fast responses and intense coloration. The fabrics coated with SiO 2 @S1 and SiO 2 @S2 showed rapid color changes and high contrasts (ΔE* ab = 39-52), despite presenting slower bleaching kinetics (2-3 h to fade to the original color), whereas the textiles coated with SiO 2 @S3 and SiO 2 @S4 exhibited excellent engagement between coloration and decoloration rates (coloration and fading times of 1 and 2 min, respectively; ΔE* ab = 27-53). The PU-based fabrics showed excellent results during the washing fastness tests, whereas the AC-based textiles evidenced good results only when a protective transfer film was applied over the printed design.

  11. Potassium ions in SiO2: electrets for silicon surface passivation

    Science.gov (United States)

    Bonilla, Ruy S.; Wilshaw, Peter R.

    2018-01-01

    This manuscript reports an experimental and theoretical study of the transport of potassium ions in thin silicon dioxide films. While alkali contamination was largely researched in the context of MOSFET instability, recent reports indicate that potassium ions can be embedded into oxide films to produce dielectric materials with permanent electric charge, also known as electrets. These electrets are integral to a number of applications, including the passivation of silicon surfaces for optoelectronic devices. In this work, electric field assisted migration of ions is used to rapidly drive K+ into SiO2 and produce effective passivation of silicon surfaces. Charge concentrations of up to ~5  ×  1012 e cm‑2 have been achieved. This charge was seen to be stable for over 1500 d, with decay time constants as high as 17 000 d, producing an effectively passivated oxide–silicon interface with SRV  <  7 cm s‑1, in 1 Ω cm n-type material. This level of charge stability and passivation effectiveness has not been previously reported. Overall, this is a new and promising methodology to enhance surface passivation for the industrial manufacture of silicon optoelectronic devices.

  12. Plasma process-induced latent damage on gate oxide - demonstrated by single-layer and multi-layer antenna structures

    NARCIS (Netherlands)

    Wang, Zhichun; Ackaert, Jan; Salm, Cora; Kuper, F.G.

    2001-01-01

    In this paper, by using both single-layer (SL) and multi-layer (ML) or stacked antenna structures, a simple experimental method is proposed to directly demonstrate the pure plasma process-induced latent damage on gate oxide without any impact of additional defects generated by normal constant

  13. Sol-gel preparation of self-cleaning SiO2-TiO2/SiO2-TiO2 double-layer antireflective coating for solar glass

    Science.gov (United States)

    Lin, Wensheng; Zheng, Jiaxian; Yan, Lianghong; Zhang, Xinxiang

    2018-03-01

    Self-cleaning SiO2-TiO2/SiO2-TiO2 double-layer antireflective (AR) coating is prepared by sol-gel process. SiO2 sol is prepared by using tetraethyl orthosilicate (TEOS) as precursor and ammonia as catalyst, while TiO2 sol was prepared by using tetrabutyl orthotitanate (TBOT) as precursor and hydrochloric acid as catalyst. The effect of TiO2 content on refractive index, abrasion-resistance and photo-catalytic activity of SiO2-TiO2 hybrid thin films or powders is systematically investigated. It is found that the refractive index of SiO2-TiO2 hybrid thin films increases gradually from 1.18 to 1.53 as the weight ratio of TiO2 to SiO2 increased from 0 to 1.0. The SiO2-TiO2 hybrid thin film and powder possesses good abrasion-resistance and photo-catalytic activity, respectively, as the weight ratio of TiO2 to SiO2 is 0.4. The degradation degree of Rhodamine B by SiO2-TiO2 hybrid powder is 88.3%. Finally, SiO2-TiO2/SiO2-TiO2 double-layer AR coating with high transmittance, abrasion-resistance and self-cleaning property is realized.

  14. LASER APPLICATIONS AND OTHER TOPICS IN QUANTUM ELECTRONICS: Synthesis of bulk SiO2 : MxOy materials in a steady-state laser plume

    Science.gov (United States)

    Lebedev, V. F.

    1997-01-01

    An analysis was made of the conditions of existence of a two-component steady-state laser plume in atmospheric air. Such a plume is used in single-stage synthesis of bulk molten materials belonging to the SiO2 : MxOy system. Targets of the SiO2 : M type (metal foil and a silica glass rod) and doping elements with boiling points below and above the boiling point of silica glass are discussed. The regimes and efficiency of steady-state transfer of the dopants are considered. The efficiency of transfer of metal oxides during growth of samples with the aid of a cw CO2 laser is reported to be ~0.05, 0.4, and 0.75g min-1 kW-1 when the mass dopant concentration is ~8%, 20%, and 60% for the oxides of Ti, Cu, and Ni, respectively.

  15. Photocatalytic hydrogen production using visible-light-responsive Ta 3N5 photocatalyst supported on monodisperse spherical SiO2 particulates

    KAUST Repository

    Liu, Xiaoming

    2014-01-01

    Fine nanoparticles of Ta3N5 (10-20 nm) were synthesized on the surfaces of SiO2 spheres with a diameter of ∼550 nm. A sol-gel method was used to modify the surface of SiO2 with Ta2O5 from TaCl5 dissolved in ethanol in the presence of citric acid and polyethylene glycol. The resulting oxide composites were treated in an NH3 flow at 1123 K to form core-shell structured Ta3N5/SiO2 sub-microspheres. The obtained samples were characterized using powder X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FT-IR), field emission scanning electron microscopy (FESEM), energy-dispersive X-ray spectra (EDX), transmission electron microscopy (TEM), and photocatalytic activity measurements for H 2 evolution from an aqueous methanol solution. The XRD results demonstrate the expected sequential formation of Ta2O5 layers, followed by Ta3N5 after nitridation on the Ta 2O5/SiO2 composite. SEM and TEM observations indicate that the obtained Ta3N5/SiO2 sub-microspheres have a uniform size distribution with high crystallinity and an obvious core-shell structure. The presence of support maintained the intrinsic photocatalytic activity of Ta3N5 nanoparticles, but it did drastically improve the dispersion of the photocatalysts in the solution. This study proposes the use of an inert support in photocatalytic reactors to improve ease of handling the powder photocatalyst for gas-phase photocatalysis and the suspension of the solution, controlling nature of light harvesting and degree of scattering of the photoreactor. © 2013 Elsevier Ltd. All rights reserved.

  16. Low-temperature PZT thin-film ferroelectric memories fabricated on SiO2/Si and glass substrates

    Directory of Open Access Journals (Sweden)

    D.H. Minh

    2016-03-01

    Full Text Available In a ferroelectric-gate thin film transistor memory (FGT type structure, the gate-insulator layer is extremely important for inducing the charge when accumulating or depleting. We concentrated on the application of low-temperature PZT films crystallized at 450, 500 and 550 °C, instead of at conventional high temperatures (≥600 °C. Investigation of the crystalline structure and electrical properties indicated that the PZT film, crystallized at 500 °C, was suitable for FGT fabrication because of a high (111 orientation, large remnant polarization of 38 μC/cm2 on SiO2/Si substrate and 17.8 μC/cm2 on glass, and low leakage current of 10−6 A/cm2. In sequence, we successfully fabricated FGT with all processes below 500 °C on a glass substrate, whose operation exhibits a memory window of 4 V, ON/OFF current ratio of 105, field-effect mobility of 0.092 cm2 V−1 s−1, and retention time of 1 h.

  17. A facile approach to fabricate Au nanoparticles loaded SiO2 microspheres for catalytic reduction of 4-nitrophenol

    International Nuclear Information System (INIS)

    Tang, Mingyi; Huang, Guanbo; Li, Xianxian; Pang, Xiaobo; Qiu, Haixia

    2015-01-01

    Hydrophilic and biocompatible macromolecules were used to improve and simplify the process for the fabrication of core/shell SiO 2 @Au composite particles. The influence of polymers on the morphology of SiO 2 @Au particles with different size of SiO 2 cores was analyzed by transmission electron microscopy and scanning electron microscopy. The optical property of the SiO 2 @Au particles was studied with UV–Vis spectroscopy. The results indicate that the structure and composition of macromolecules affect the morphology of Au layers on SiO 2 microspheres. The SiO 2 @Au particles prepared in the presence of polyvinyl alcohol (PVA) or polyvinylpyrrolidone (PVP) have thin and complete Au nanoshells owing to their inducing act in preferential growth of Au nanoparticles along the surface of SiO 2 microspheres. SiO 2 @Au particles can be also prepared from SiO 2 microspheres modified with 3-aminopropyltrimethoxysilane in the presence of PVA or PVP. This offers a simple way to fabricate a Au layer on SiO 2 or other microspheres. The SiO 2 @Au particles demonstrated high catalytic activity in the reduction of 4-nitrophenol. - Highlights: • Facile direct deposition method for Au nanoparticles on silica microspheres. • Influence of different types of macromolecule on the formation of Au shell. • High catalytic performance of Au nanoparticles on silica microspheres

  18. The influence of the gate oxide growing way to the radiation effects of the CMOS op-amp

    International Nuclear Information System (INIS)

    Lu Wu; Guo Qi; Ren Diyuan; Yu Xuefeng; Zhang Guoqiang; Yan Rongliang

    2000-01-01

    The total dose effects of the CMOS op-amps whose transistor gates were produced separately with the dry O 2 and H 2 + O 2 process have been investigated. By comparing the radiation effects between the two circuits and their inner transistors, the authors have explored the causes made the difference of the two amplifiers' sensitivity to the irradiation. It is shown that the way of the gate oxide growing is one of key factors of influencing the performance of the op-amplifiers in total dose radiation environment

  19. Dry etched SiO2 Mask for HgCdTe Etching Process

    Science.gov (United States)

    Chen, Y. Y.; Ye, Z. H.; Sun, C. H.; Deng, L. G.; Zhang, S.; Xing, W.; Hu, X. N.; Ding, R. J.; He, L.

    2016-09-01

    A highly anisotropic etching process with low etch-induced damage is indispensable for advanced HgCdTe (MCT) infrared focal plane array (IRFPA) detectors. The inductively coupled plasma (ICP) enhanced reactive ion etching technique has been widely adopted in manufacturing HgCdTe IRFPA devices. An accurately patterned mask with sharp edges is decisive to accomplish pattern duplication. It has been reported by our group that the SiO2 mask functions well in etching HgCdTe with high selectivity. However, the wet process in defining the SiO2 mask is limited by ambiguous edges and nonuniform patterns. In this report, we patterned SiO2 with a mature ICP etching technique, prior to which a thin ZnS film was deposited by thermal evaporation. The SiO2 film etching can be terminated at the auto-stopping point of the ZnS layer thanks to the high selectivity of SiO2/ZnS in SF6 based etchant. Consequently, MCT etching was directly performed without any other treatment. This mask showed acceptable profile due to the maturity of the SiO2 etching process. The well-defined SiO2 pattern and the etched smooth surfaces were investigated with scanning electron microscopy and atomic force microscope. This new mask process could transfer the patterns exactly with very small etch-bias. A cavity with aspect-ratio (AR) of 1.2 and root mean square roughness of 1.77 nm was achieved first, slightly higher AR of 1.67 was also get with better mask profile. This masking process ensures good uniformity and surely benefits the delineation of shrinking pixels with its high resolution.

  20. Tunable graphene doping by modulating the nanopore geometry on a SiO2/Si substrate

    KAUST Repository

    Lim, Namsoo

    2018-02-28

    A tunable graphene doping method utilizing a SiO2/Si substrate with nanopores (NP) was introduced. Laser interference lithography (LIL) using a He–Cd laser (λ = 325 nm) was used to prepare pore size- and pitch-controllable NP SiO2/Si substrates. Then, bottom-contact graphene field effect transistors (G-FETs) were fabricated on the NP SiO2/Si substrate to measure the transfer curves. The graphene transferred onto the NP SiO2/Si substrate showed relatively n-doped behavior compared to the graphene transferred onto a flat SiO2/Si substrate, as evidenced by the blue-shift of the 2D peak position (∼2700 cm−1) in the Raman spectra due to contact doping. As the porosity increased within the substrate, the Dirac voltage shifted to a more positive or negative value, depending on the initial doping type (p- or n-type, respectively) of the contact doping. The Dirac voltage shifts with porosity were ascribed mainly to the compensation for the reduced capacitance owing to the SiO2–air hetero-structured dielectric layer within the periodically aligned nanopores capped by the suspended graphene (electrostatic doping). The hysteresis (Dirac voltage difference during the forward and backward scans) was reduced when utilizing an NP SiO2/Si substrate with smaller pores and/or a low porosity because fewer H2O or O2 molecules could be trapped inside the smaller pores.

  1. Paramagnetic point defects in amorphous thin films of SiO2 and Si3N4: An update

    Science.gov (United States)

    Poindexter, E. H.; Warren, W. L.

    Recent research on point defects in thin films of SiO2 and Si3SN4 on Si is presented and reviewed. In SiO2 it is now clear that no one type of E(prime) center is the sole source of radiation-induced positive charge; hydrogenous moieties or other types of E(prime) are proposed. Molecular orbital theory and easy passivation of E(prime) by H2 suggest that released H might depassivate P(sub b) sites. A charged E(prime)(sub delta) center has been seen in Cl-free SIMOX and thermal oxide film, and it is reassigned to an electron delocalized over four O3 triple bond Si units around a fifth Si. In Si3N4 a new model for the amphoteric charging of Si triple bond N3 moieties is based on local shifts in defect energy with respect to the Fermi level, arising from nonuniform composition; it does not assume negative-U electron correlation. A new defect NN(sub 2)(sup 0) has been identified, with dangling orbital on a 2-coordinated N atom bonded to another N.

  2. Atom probe tomography analysis of SiGe fins embedded in SiO2: Facts and artefacts.

    Science.gov (United States)

    Melkonyan, D; Fleischmann, C; Arnoldi, L; Demeulemeester, J; Kumar, A; Bogdanowicz, J; Vurpillot, F; Vandervorst, W

    2017-08-01

    We present atom probe analysis of 40nm wide SiGe fins embedded in SiO 2 and discuss the root cause of artefacts observed in the reconstructed data. Additionally, we propose a simple data treatment routine, relying on complementary transmission electron microscopy analysis, to improve compositional analysis of the embedded SiGe fins. Using field evaporation simulations, we show that for high oxide to fin width ratios the difference in evaporation field thresholds between SiGe and SiO 2 results in a non-hemispherical emitter shape with a negative curvature in the direction across, but not along the fin. This peculiar emitter shape leads to severe local variations in radius and hence in magnification across the emitter apex causing ion trajectory aberrations and crossings. As shown by our experiments and simulations, this translates into unrealistic variations in the detected atom densities and faulty dimensions in the reconstructed volume, with the width of the fin being up to six-fold compressed. Rectification of the faulty dimensions and density variations in the SiGe fin was demonstrated with our dedicated data treatment routine. Copyright © 2017 Elsevier B.V. All rights reserved.

  3. Toluene and chlorobenzene dinitration over solid H3PO4/MoO3/SiO2 catalyst.

    Science.gov (United States)

    Adamiak, Joanna; Kalinowska-Alichnewicz, Dorota; Szadkowski, Michał; Skupiński, Wincenty

    2011-11-15

    A new catalyst, H(3)PO(4)/MoO(3)/SiO(2), was prepared by modification of MoO(3)/SiO(2) using phosphoric acid. The characterization of the catalyst was performed using Infrared and Raman Spectroscopy, potentiometric titration and nitrogen adsorption-desorption methods. Molybdenum oxides were identified along with phosphomolybdic acid and polymolybdates on the modified surface. The suitability of the catalysts for toluene and chlorobenzene nitration in continuous process was examined. Toluene is effectively nitrated to dinitrotoluene (DNT) in one-stage process (96 wt.% of DNT in the product) and in mild conditions i.e. at room temperature and only with ten-fold excess of nitric acid. In chlorobenzene nitration only twelve-fold excess of nitric acid is needed to obtain as high yield as 95 wt.%. Most importantly, the novel catalysts we have developed, provide the opportunity for sulfuric acid- free nitration of aromatic compounds. Copyright © 2011 Elsevier B.V. All rights reserved.

  4. Photo-induced tunneling currents in MOS structures with various HfO2/SiO2 stacking dielectrics

    Directory of Open Access Journals (Sweden)

    Chin-Sheng Pang

    2014-04-01

    Full Text Available In this study, the current conduction mechanisms of structures with tandem high-k dielectric in illumination are discussed. Samples of Al/SiO2/Si (S, Al/HfO2/SiO2/Si (H, and Al/3HfO2/SiO2/Si (3H were examined. The significant observation of electron traps of sample H compares to sample S is found under the double bias capacitance-voltage (C-V measurements in illumination. Moreover, the photo absorption sensitivity of sample H is higher than S due to the formation of HfO2 dielectric layer, which leads to larger numbers of carriers crowded through the sweep of VG before the domination of tunneling current. Additionally, the HfO2 dielectric layer would block the electrons passing through oxide from valance band, which would result in less electron-hole (e−-h+ pairs recombination effect. Also, it was found that both of the samples S and H show perimeter dependency of positive bias currents due to strong fringing field effect in dark and illumination; while sample 3H shows area dependency of positive bias currents in strong illumination. The non-uniform tunneling current through thin dielectric and through HfO2 stacking layers are importance to MOS(p tunneling photo diodes.

  5. Solution-Processed Rare-Earth Oxide Thin Films for Alternative Gate Dielectric Application.

    Science.gov (United States)

    Zhuang, Jiaqing; Sun, Qi-Jun; Zhou, Ye; Han, Su-Ting; Zhou, Li; Yan, Yan; Peng, Haiyan; Venkatesh, Shishir; Wu, Wei; Li, Robert K Y; Roy, V A L

    2016-11-16

    Previous investigations on rare-earth oxides (REOs) reveal their high possibility as dielectric films in electronic devices, while complicated physical methods impede their developments and applications. Herein, we report a facile route to fabricate 16 REOs thin insulating films through a general solution process and their applications in low-voltage thin-film transistors as dielectrics. The formation and properties of REOs thin films are analyzed by atomic force microscopy (AFM), X-ray diffraction (XRD), spectroscopic ellipsometry, water contact angle measurement, X-ray photoemission spectroscopy (XPS), and electrical characterizations, respectively. Ultrasmooth, amorphous, and hydrophilic REO films with thickness around 10 nm have been obtained through a combined spin-coating and postannealing method. The compositional analysis results reveal the formation of RE hydrocarbonates on the surface and silicates at the interface of REOs films annealed on Si substrate. The dielectric properties of REO films are investigated by characterizing capacitors with a Si/Ln 2 O 3 /Au (Ln = La, Gd, and Er) structure. The observed low leakage current densities and large areal capacitances indicate these REO films can be employed as alternative gate dielectrics in transistors. Thus, we have successfully fabricated a series of low-voltage organic thin-film transistors based on such sol-gel derived REO films to demonstrate their application in electronics. The optimization of REOs dielectrics in transistors through further surface modification has also been studied. The current study provides a simple solution process approach to fabricate varieties of REOs insulating films, and the results reveal their promising applications as alternative gate dielectrics in thin-film transistors.

  6. Fast transporting ZnO-TiO2 coaxial photoanodes for dye-sensitized solar cells based on ALD-modified SiO2 aerogel frameworks.

    Science.gov (United States)

    Williams, Vennesa O; Jeong, Nak Cheon; Prasittichai, Chaiya; Farha, Omar K; Pellin, Michael J; Hupp, Joseph T

    2012-07-24

    A doubly coaxial photoanode architecture based on templated SiO(2) aerogels was fabricated on transparent conducting oxides for use in dye-sensitized solar cells (DSSCs). These templates were coated with ZnO via atomic layer deposition (ALD) to yield an electronically interconnected, low-density, high-surface-area, semiconductor framework. Addition of a thin conformal layer of a second metal oxide (alumina, zirconia, or titania) via ALD was found to suppress the dissolution of ZnO that otherwise occurs when it is soaked in alcohol solutions containing acidic dyes used for sensitization or in acetonitrile solutions containing a pyridine derivative and the iodide/tri-iodide (I(-)/I(-)(3)) redox shuttle. Electron transport in SiO(2)-ZnO-TiO(2) photoelectrodes was found to be nearly 2 orders of magnitude faster than in SiO(2)-TiO(2) structures, implying that the interior ZnO sheath serves as the primary electron conduit. In contrast, rates of electron interception by the oxidized form of the redox shuttle were observed to decrease when a TiO(2) shell was added to SiO(2)-ZnO, with the decreases becoming more significant as the thickness of the titania shell increases. These effects lead to improvements in efficiency for DSSCs that utilize I(-)/I(-)(3), but much larger improvements for DSSCs utilizing ferrocene/ferrocenium, a notoriously fast redox shuttle. For the former, overall energy conversion efficiencies maximize at 4.0%. From a variety of experiments, the primary factor limiting aerogel-based DSSC performance is light loss due to scattering. Nevertheless, variants of the doubly coaxial structure may prove useful in devising DSSCs that can achieve excellent energy conversion efficiencies even with fast redox shuttles.

  7. Integrated nanophotonic hubs based on ZnO-Tb(OH3/SiO2 nanocomposites

    Directory of Open Access Journals (Sweden)

    Lin Yu

    2011-01-01

    Full Text Available Abstract Optical integration is essential for practical application, but it remains unexplored for nanoscale devices. A newly designed nanocomposite based on ZnO semiconductor nanowires and Tb(OH3/SiO2 core/shell nanospheres has been synthesized and studied. The unique sea urchin-type morphology, bright and sharply visible emission bands of lanthanide, and large aspect ratio of ZnO crystalline nanotips make this novel composite an excellent signal receiver, waveguide, and emitter. The multifunctional composite of ZnO nanotips and Tb(OH3/SiO2 nanoparticles therefore can serve as an integrated nanophotonics hub. Moreover, the composite of ZnO nanotips deposited on a Tb(OH3/SiO2 photonic crystal can act as a directional light fountain, in which the confined radiation from Tb ions inside the photonic crystal can be well guided and escape through the ZnO nanotips. Therefore, the output emission arising from Tb ions is truly directional, and its intensity can be greatly enhanced. With highly enhanced lasing emissions in ZnO-Tb(OH3/SiO2 as well as SnO2-Tb(OH3/SiO2 nanocomposites, we demonstrate that our approach is extremely beneficial for the creation of low threshold and high-power nanolaser.

  8. Integrated nanophotonic hubs based on ZnO-Tb(OH)3/SiO2 nanocomposites

    Science.gov (United States)

    Lin, Hsia Yu; Cheng, Chung Liang; Lin, Yu Shen; Hung, Yann; Mou, Chung Yuan; Chen, Yang Fang

    2011-08-01

    Optical integration is essential for practical application, but it remains unexplored for nanoscale devices. A newly designed nanocomposite based on ZnO semiconductor nanowires and Tb(OH)3/SiO2 core/shell nanospheres has been synthesized and studied. The unique sea urchin-type morphology, bright and sharply visible emission bands of lanthanide, and large aspect ratio of ZnO crystalline nanotips make this novel composite an excellent signal receiver, waveguide, and emitter. The multifunctional composite of ZnO nanotips and Tb(OH)3/SiO2 nanoparticles therefore can serve as an integrated nanophotonics hub. Moreover, the composite of ZnO nanotips deposited on a Tb(OH)3/SiO2 photonic crystal can act as a directional light fountain, in which the confined radiation from Tb ions inside the photonic crystal can be well guided and escape through the ZnO nanotips. Therefore, the output emission arising from Tb ions is truly directional, and its intensity can be greatly enhanced. With highly enhanced lasing emissions in ZnO-Tb(OH)3/SiO2 as well as SnO2-Tb(OH)3/SiO2 nanocomposites, we demonstrate that our approach is extremely beneficial for the creation of low threshold and high-power nanolaser.

  9. Effects of Gate Stack Structural and Process Defectivity on High-k Dielectric Dependence of NBTI Reliability in 32 nm Technology Node PMOSFETs

    Directory of Open Access Journals (Sweden)

    H. Hussin

    2014-01-01

    Full Text Available We present a simulation study on negative bias temperature instability (NBTI induced hole trapping in E′ center defects, which leads to depassivation of interface trap precursor in different geometrical structures of high-k PMOSFET gate stacks using the two-stage NBTI model. The resulting degradation is characterized based on the time evolution of the interface and hole trap densities, as well as the resulting threshold voltage shift. By varying the physical thicknesses of the interface silicon dioxide (SiO2 and hafnium oxide (HfO2 layers, we investigate how the variation in thickness affects hole trapping/detrapping at different stress temperatures. The results suggest that the degradations are highly dependent on the physical gate stack parameters for a given stress voltage and temperature. The degradation is more pronounced by 5% when the thicknesses of HfO2 are increased but is reduced by 11% when the SiO2 interface layer thickness is increased during lower stress voltage. However, at higher stress voltage, greater degradation is observed for a thicker SiO2 interface layer. In addition, the existence of different stress temperatures at which the degradation behavior differs implies that the hole trapping/detrapping event is thermally activated.

  10. A Nonvolatile MOSFET Memory Device Based on Mobile Protons in SiO(2) Thin Films

    Energy Technology Data Exchange (ETDEWEB)

    Vanheusden, K.; Warren, W.L.; Devine, R.A.B.; Fleetwood, D.M.; Draper, B.L.; Schwank, J.R.

    1999-03-02

    It is shown how mobile H{sup +} ions can be generated thermally inside the oxide layer of Si/SiO{sub 2}/Si structures. The technique involves only standard silicon processing steps: the nonvolatile field effect transistor (NVFET) is based on a standard MOSFET with thermally grown SiO{sub 2} capped with a poly-silicon layer. The capped thermal oxide receives an anneal at {approximately}1100 C that enables the incorporation of the mobile protons into the gate oxide. The introduction of the protons is achieved by a subsequent 500-800 C anneal in a hydrogen-containing ambient, such as forming gas (N{sub 2}:H{sub 2} 95:5). The mobile protons are stable and entrapped inside the oxide layer, and unlike alkali ions, their space-charge distribution can be controlled and rapidly rearranged at room temperature by an applied electric field. Using this principle, a standard MOS transistor can be converted into a nonvolatile memory transistor that can be switched between normally on and normally off. Switching speed, retention, endurance, and radiation tolerance data are presented showing that this non-volatile memory technology can be competitive with existing Si-based non-volatile memory technologies such as the floating gate technologies (e.g. Flash memory).

  11. Semiconductor to metallic transition in bulk accumulated amorphous indium-gallium-zinc-oxide dual gate thin-film transistor

    Directory of Open Access Journals (Sweden)

    Minkyu Chun

    2015-05-01

    Full Text Available We investigated the effects of top gate voltage (VTG and temperature (in the range of 25 to 70 oC on dual-gate (DG back-channel-etched (BCE amorphous-indium-gallium-zinc-oxide (a-IGZO thin film transistors (TFTs characteristics. The increment of VTG from -20V to +20V, decreases the threshold voltage (VTH from 19.6V to 3.8V and increases the electron density to 8.8 x 1018cm−3. Temperature dependent field-effect mobility in saturation regime, extracted from bottom gate sweep, show a critical dependency on VTG. At VTG of 20V, the mobility decreases from 19.1 to 15.4 cm2/V ⋅ s with increasing temperature, showing a metallic conduction. On the other hand, at VTG of - 20V, the mobility increases from 6.4 to 7.5cm2/V ⋅ s with increasing temperature. Since the top gate bias controls the position of Fermi level, the temperature dependent mobility shows metallic conduction when the Fermi level is above the conduction band edge, by applying high positive bias to the top gate.

  12. Petrogenesis of coexisting SiO 2-undersaturated to SiO 2-oversaturated felsic igneous rocks: The alkaline complex of Itatiaia, southeastern Brazil

    Science.gov (United States)

    Brotzu, P.; Gomes, C. B.; Melluso, L.; Morbidelli, L.; Morra, V.; Ruberti, E.

    1997-07-01

    The Itatiaia alkaline complex is a Late Cretaceous intrusion (72 Myr) made up of felsic differentiates, with syenitic rocks dominant throughout and with presence of both nepheline- and quartz-rich varieties. Dykes with phonolitic or trachytic composition cross-cut the coarse-grained facies. The rocks are arranged concentrically, with the core of the complex being formed by SiO 2-oversaturated syenites (with a small outcrop of granites), and are radially displaced by faults related to regional tectonic lineaments. The minerals show gradual but significant changes in composition (salitic and augitic to aegirine-rich pyroxenes, hastingsite and actinolite to richterite and arfvedsonite amphiboles, sodic plagioclase to orthoclase feldspars and so on) and the whole-rock trends are broadly consistent with fractional crystallization processes dominated by alkali feldspar removal. Sr-isotopic data indicate more radiogenic ratios for the SiO 2-oversaturated rocks (0.7062-0.7067 against 0.7048-0.7054 for the SiO 2-undersaturated syenites), consistent with small amounts of crustal input. The favored hypothesis for the petrogenesis of the different syenitic groups is the prolonged differentiation starting from differently SiO 2-undersaturated mafic parental magmas (potassic alkali basalts to ankaratrites, present in the Late Cretaceous dyke swarms of the area), accompanied by variable crustal contamination prior to the final emplacement. The lack of carbonatite as a significant lithotype, the potassic affinity of the Itatiaia complex, and the relatively high Sr-isotopic ratios match the characteristics of the other complexes of the Rio de Janeiro-Sa˜o Paulo states coastline and confirm the ultimate derivation of these differentiated rocks from an enriched lithospheric mantle source.

  13. Frequency-Stable Ionic-Type Hybrid Gate Dielectrics for High Mobility Solution-Processed Metal-Oxide Thin-Film Transistors

    Directory of Open Access Journals (Sweden)

    Jae Sang Heo

    2017-06-01

    Full Text Available In this paper, we demonstrate high mobility solution-processed metal-oxide thin-film transistors (TFTs by using a high-frequency-stable ionic-type hybrid gate dielectric (HGD. The HGD gate dielectric, a blend of sol-gel aluminum oxide (AlOx and poly(4-vinylphenol (PVP, exhibited high dielectric constant (ε~8.15 and high-frequency-stable characteristics (1 MHz. Using the ionic-type HGD as a gate dielectric layer, an minimal electron-double-layer (EDL can be formed at the gate dielectric/InOx interface, enhancing the field-effect mobility of the TFTs. Particularly, using the ionic-type HGD gate dielectrics annealed at 350 °C, InOx TFTs having an average field-effect mobility of 16.1 cm2/Vs were achieved (maximum mobility of 24 cm2/Vs. Furthermore, the ionic-type HGD gate dielectrics can be processed at a low temperature of 150 °C, which may enable their applications in low-thermal-budget plastic and elastomeric substrates. In addition, we systematically studied the operational stability of the InOx TFTs using the HGD gate dielectric, and it was observed that the HGD gate dielectric effectively suppressed the negative threshold voltage shift during the negative-illumination-bias stress possibly owing to the recombination of hole carriers injected in the gate dielectric with the negatively charged ionic species in the HGD gate dielectric.

  14. O-vacancies in (i) nano-crystalline HfO2 and (i) non-crystalline SiO2 and Si3N4 studied by X-ray absorption spectroscopy.

    Science.gov (United States)

    Lucovsky, Gerald; Miotti, Leonardo; Bastos, Karen Paz

    2012-06-01

    Performance and reliability in semiconductor devices are limited by electronically active defects, primarily O-atom and N-atom vacancies. Synchrotron X-ray spectroscopy results, interpreted in the context of two-electron multiplet theories, have been used to analyze conduction band edge, and O-vacancy defect states in nano-crystalline transition metal oxides, e.g., HfO2, and the noncrystalline dielectrics, SiO2, Si3N4 and Si-oxynitride alloys. Two-electron multiplet theory been used to develop a high-spin state equivalent d2 model for O-vacancy allowed transitions and negative ion states as detected by X-ray absorption spectroscopy in the O K pre-edge regime. Comparisons between theory and experiment have used Tanabe-Sugano energy level diagrams for determining the symmetries and relative energies of intra-d-state transitions for an equivalent d2 ground state occupancy. Trap-assisted-tunneling, Poole-Frenkel hopping transport, and the negative bias temperature instability have been explained in terms of injection and/or trapping into O-atom and N-atom vacancy sites, and applied to gate dielectric, and metal-insulator-metal structures.

  15. Highly stable piezo-immunoglobulin-biosensing of a SiO2/ZnO nanogenerator as a self-powered/active biosensor arising from the field effect influenced piezoelectric screening effect

    Science.gov (United States)

    Zhao, Yayu; Fu, Yongming; Wang, Penglei; Xing, Lili; Xue, Xinyu

    2015-01-01

    Highly stable piezo-immunoglobulin-biosensing has been realized from a SiO2/ZnO nanowire (NW) nanogenerator (NG) as a self-powered/active biosensor. The piezoelectric output generated by the SiO2/ZnO NW NG can act not only as a power source for driving the device, but also as a sensing signal for detecting immunoglobulin G (IgG). The stability of the device is very high, and the relative standard deviation (RSD) ranges from 1.20% to 4.20%. The limit of detection (LOD) of IgG on the device can reach 5.7 ng mL-1. The response of the device is in a linear relationship with IgG concentration. The biosensing performance of SiO2/ZnO NWs is much higher than that of bare ZnO NWs. A SiO2 layer uniformly coated on the surface of the ZnO NW acts as the gate insulation layer, which increases mechanical robustness and protects it from the electrical leakages and short circuits. The IgG biomolecules modified on the surface of the SiO2/ZnO NW act as a gate potential, and the field effect can influence the surface electron density of ZnO NWs, which varies the screening effect of free-carriers on the piezoelectric output. The present results demonstrate a feasible approach for a highly stable self-powered/active biosensor.

  16. Highly stable piezo-immunoglobulin-biosensing of a SiO2/ZnO nanogenerator as a self-powered/active biosensor arising from the field effect influenced piezoelectric screening effect.

    Science.gov (United States)

    Zhao, Yayu; Fu, Yongming; Wang, Penglei; Xing, Lili; Xue, Xinyu

    2015-02-07

    Highly stable piezo-immunoglobulin-biosensing has been realized from a SiO2/ZnO nanowire (NW) nanogenerator (NG) as a self-powered/active biosensor. The piezoelectric output generated by the SiO2/ZnO NW NG can act not only as a power source for driving the device, but also as a sensing signal for detecting immunoglobulin G (IgG). The stability of the device is very high, and the relative standard deviation (RSD) ranges from 1.20% to 4.20%. The limit of detection (LOD) of IgG on the device can reach 5.7 ng mL(-1). The response of the device is in a linear relationship with IgG concentration. The biosensing performance of SiO2/ZnO NWs is much higher than that of bare ZnO NWs. A SiO2 layer uniformly coated on the surface of the ZnO NW acts as the gate insulation layer, which increases mechanical robustness and protects it from the electrical leakages and short circuits. The IgG biomolecules modified on the surface of the SiO2/ZnO NW act as a gate potential, and the field effect can influence the surface electron density of ZnO NWs, which varies the screening effect of free-carriers on the piezoelectric output. The present results demonstrate a feasible approach for a highly stable self-powered/active biosensor.

  17. SiO2 coating of silver nanoparticles by photoinduced chemical vapor deposition.

    Science.gov (United States)

    Boies, Adam M; Roberts, Jeffrey T; Girshick, Steven L; Zhang, Bin; Nakamura, Toshitaka; Mochizuki, Amane

    2009-07-22

    Gas-phase silver nanoparticles were coated with silicon dioxide (SiO2) by photoinduced chemical vapor deposition (photo-CVD). Silver nanoparticles, produced by inert gas condensation, and a SiO2 precursor, tetraethylorthosilicate (TEOS), were exposed to vacuum ultraviolet (VUV) radiation at atmospheric pressure and varying temperatures. The VUV photons dissociate the TEOS precursor, initiating a chemical reaction that forms SiO2 coatings on the particle surfaces. Coating thicknesses were measured for a variety of operation parameters using tandem differential mobility analysis and transmission electron microscopy. The chemical composition of the particle coatings was analyzed using energy dispersive x-ray spectrometry and Fourier transform infrared spectroscopy. The highest purity films were produced at 300-400 degrees C with low flow rates of additional oxygen. The photo-CVD coating technique was shown to effectively coat nanoparticles and limit core particle agglomeration at concentrations up to 10(7) particles cm(-3).

  18. Ion assisted deposition of SiO2 film from silicon

    Science.gov (United States)

    Pham, Tuan. H.; Dang, Cu. X.

    2005-09-01

    Silicon dioxide, SiO2, is one of the preferred low index materials for optical thin film technology. It is often deposited by electron beam evaporation source with less porosity and scattering, relatively durable and can have a good laser damage threshold. Beside these advantages the deposition of critical optical thin film stacks with silicon dioxide from an E-gun was severely limited by the stability of the evaporation pattern or angular distribution of the material. The even surface of SiO2 granules in crucible will tend to develop into groove and become deeper with the evaporation process. As the results, angular distribution of the evaporation vapor changes in non-predicted manner. This report presents our experiments to apply Ion Assisted Deposition process to evaporate silicon in a molten liquid form. By choosing appropriate process parameters we can get SiO2 film with good and stable property.

  19. Semiconductor nanocrystals formed in SiO2 by ion implantation

    International Nuclear Information System (INIS)

    Zhu, J.G.; White, C.W.; Budai, J.D.; Withrow, S.P.; Chen, Y.

    1994-11-01

    Nanocrystals of group IV (Si, Ge and SiGe), III-V (GaAs), and II-VI (CdSe) semiconductor materials have been fabricated inside SiO 2 by ion implantation and subsequent thermal annealing. The microstructure of these nanocrystalline semiconductor materials has been studied by transmission electron microscopy (TEM). The nanocrystals form in near-spherical shape with random crystal orientations in amorphous SiO 2 . Extensive studies on the nanocrystal size distributions have been carried out for the Ge nanocrystals by changing the implantation doses and the annealing temperatures. Remarkable roughening of the nanocrystals occurs when the annealing temperature is raised over the melting temperature of the implanted semiconductor material. Strong red photoluminescence peaked around 1.67 eV has been achieved in samples with Si nanocrystals in SiO 2

  20. SiO2 coating of silver nanoparticles by photoinduced chemical vapor deposition

    International Nuclear Information System (INIS)

    Boies, Adam M; Girshick, Steven L; Roberts, Jeffrey T; Zhang Bin; Nakamura, Toshitaka; Mochizuki, Amane

    2009-01-01

    Gas-phase silver nanoparticles were coated with silicon dioxide (SiO 2 ) by photoinduced chemical vapor deposition (photo-CVD). Silver nanoparticles, produced by inert gas condensation, and a SiO 2 precursor, tetraethylorthosilicate (TEOS), were exposed to vacuum ultraviolet (VUV) radiation at atmospheric pressure and varying temperatures. The VUV photons dissociate the TEOS precursor, initiating a chemical reaction that forms SiO 2 coatings on the particle surfaces. Coating thicknesses were measured for a variety of operation parameters using tandem differential mobility analysis and transmission electron microscopy. The chemical composition of the particle coatings was analyzed using energy dispersive x-ray spectrometry and Fourier transform infrared spectroscopy. The highest purity films were produced at 300-400 0 C with low flow rates of additional oxygen. The photo-CVD coating technique was shown to effectively coat nanoparticles and limit core particle agglomeration at concentrations up to 10 7 particles cm -3 .

  1. The hydrophobic and omnidirectional antireflection coating of SiO2 nanospheres with C18-TEOS

    Science.gov (United States)

    Hsu, Cheng-Chih; Lan, Wen-Lin; Chen, Nien-Po; Wu, Chyan-Chyi

    2014-06-01

    This paper demonstrates the antireflection coating of SiO2 nanospheres applied to cover glass by using the optimal spin-coating method. Because of the hydrolysis and condensation reactions between the SiO2 nanosphere antireflection (AR) coating and n-octadecyltriethoxysilane solution (C18-TEOS), the contact angle of the AR coating with hydrophobic treatment is improved approximately 38%, and the moisture-resistance remains unchanged, which preserved similar transmittance for six weeks. Furthermore, the AR coating with hydrophobic treatment exhibits approximately 3% and 7% improvement in the transmittance at normal and oblique incidence, respectively. The hydrophobic and omnidirectional AR coating with nanoscale SiO2 particles can be fabricated using the proposed simple and economical method.

  2. Electrothermal Actuators for SiO2 Photonic MEMS

    Directory of Open Access Journals (Sweden)

    Tjitte-Jelte Peters

    2016-11-01

    Full Text Available This paper describes the design, fabrication and characterization of electrothermal bimorph actuators consisting of polysilicon on top of thick (>10 μ m silicon dioxide beams. This material platform enables the integration of actuators with photonic waveguides, producing mechanically-flexible photonic waveguide structures that are positionable. These structures are explored as part of a novel concept for highly automated, sub-micrometer precision chip-to-chip alignment. In order to prevent residual stress-induced fracturing that is associated with the release of thick oxide structures from a silicon substrate, a special reinforcement method is applied to create suspended silicon dioxide beam structures. The characterization includes measurements of the post-release deformation (i.e., without actuation, as well as the deflection resulting from quasi-static and dynamic actuation. The post-release deformation reveals a curvature, resulting in the free ends of 800 μ m long silicon dioxide beams with 5 μ m-thick polysilicon to be situated approximately 80 μ m above the chip surface. Bimorph actuators that are 800 μ m in length produce an out-of-plane deflection of approximately 11 μ m at 60 mW dissipated power, corresponding to an estimated 240 ∘ C actuator temperature. The delivered actuation force of the 800 μ m-long bimorph actuators having 5 μ m-thick polysilicon is calculated to be approximately 750 μN at 120 mW .

  3. Preparation and luminescence properties of SiO2@LaBO3:Eu3+ nanoparticles

    Science.gov (United States)

    Qin, Chuanxiang; Qin, Lin; Chen, Guoqiang; Xu, Haitao; Lin, Tong

    2013-08-01

    Spherical SiO2 particles having a LaBO3:Eu3+ shell have been prepared by coating of silica nanoparticles (size around 130-150 nm) with a LaBO3:Eu3+ sol-gel precursor and subsequent calcination. The SiO2@LaBO3:Eu3+ nanoparticles were characterized by X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), scanning electron microscopy, and transmission electron microscopy. The XRD and FTIR results revealed that the LaBO3:Eu3+ layer on SiO2 nanoparticles formed an H-LaBO3 crystal phase when calcination at a temperature up to 700 °C. Both excitation and emission properties were characterized. The strong excitation lines at 393 and 465 nm of SiO2@LaBO3:Eu3+ indicated that the core-shell phosphor matched well with the output wavelength of near-UV (350-400 nm) or blue LED (450 nm) chips in phosphor-converted W-LEDs. The emission spectra of the 5D0 → 7F J ( J = 0, 1, 2, 3, and 4) transitions at blue/near-UV light showed strong emission lines around 615 nm which were attributed to the induced electric dipole transition of 5D0 → 7F2. The coating cycles affected the luminescence of SiO2@LaBO3:Eu3+ nanoparticles and their CIE chromaticity coordinate shifted from orange-red to the deep red zone with the increase in the coating cycles (up to 3). The luminescence lifetime of the Eu3+ ions in SiO2@LaBO3:Eu3+ was 2.32 ms. Such a luminescent material may be useful for display and light applications.

  4. Short-Term Synaptic Plasticity Regulation in Solution-Gated Indium-Gallium-Zinc-Oxide Electric-Double-Layer Transistors.

    Science.gov (United States)

    Wan, Chang Jin; Liu, Yang Hui; Zhu, Li Qiang; Feng, Ping; Shi, Yi; Wan, Qing

    2016-04-20

    In the biological nervous system, synaptic plasticity regulation is based on the modulation of ionic fluxes, and such regulation was regarded as the fundamental mechanism underlying memory and learning. Inspired by such biological strategies, indium-gallium-zinc-oxide (IGZO) electric-double-layer (EDL) transistors gated by aqueous solutions were proposed for synaptic behavior emulations. Short-term synaptic plasticity, such as paired-pulse facilitation, high-pass filtering, and orientation tuning, was experimentally emulated in these EDL transistors. Most importantly, we found that such short-term synaptic plasticity can be effectively regulated by alcohol (ethyl alcohol) and salt (potassium chloride) additives. Our results suggest that solution gated oxide-based EDL transistors could act as the platforms for short-term synaptic plasticity emulation.

  5. Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

    International Nuclear Information System (INIS)

    Kluth, P.; Johannessen, B.; Giraud, V.; Cheung, A.; Glover, C.J.; Azevedo, G. de M; Foran, G.J.; Ridgway, M.C.

    2004-01-01

    Au nanocrystals (NCs) fabricated by ion implantation into thin SiO 2 and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO 2 matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 A

  6. High performance high-κ/metal gate complementary metal oxide semiconductor circuit element on flexible silicon

    KAUST Repository

    Sevilla, Galo T.

    2016-02-29

    Thinned silicon based complementary metal oxide semiconductor(CMOS)electronics can be physically flexible. To overcome challenges of limited thinning and damaging of devices originated from back grinding process, we show sequential reactive ion etching of silicon with the assistance from soft polymeric materials to efficiently achieve thinned (40 μm) and flexible (1.5 cm bending radius) silicon based functional CMOSinverters with high-κ/metal gate transistors. Notable advances through this study shows large area of silicon thinning with pre-fabricated high performance elements with ultra-large-scale-integration density (using 90 nm node technology) and then dicing of such large and thinned (seemingly fragile) pieces into smaller pieces using excimer laser. The impact of various mechanical bending and bending cycles show undeterred high performance of flexible siliconCMOSinverters. Future work will include transfer of diced silicon chips to destination site, interconnects, and packaging to obtain fully flexible electronic systems in CMOS compatible way.

  7. Electron retention in InAs-nanocrystals embedded in SiO2/Si for non-volatile memories

    International Nuclear Information System (INIS)

    Hocevar, M.; Regreny, P.; Gendry, M.; Poncet, A.; Souifi, A.

    2008-01-01

    In this paper we present the electrical characterization of an InAs nanocrystal based metal-oxide-semiconductor structure. The fabricated device behaves as a memory since the charges injected in the InAs through the SiO 2 tunnel layer (holes or electrons) have a long retention time in or by the nanocrystals. A discharging model based on direct tunnelling through a dielectric barrier has been used in order to calculate electron discharging kinetics. The results show that InAs-nanocrystals are of real interest for electron storage in non-volatile memories with an improvement of data retention for electron. (copyright 2008 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)

  8. Enhanced Formation of Si Nanocrystals in SiO2 by Light-Filtering Rapid Thermal Annealing

    Science.gov (United States)

    Chen, Xiaobo; Chen, Guangping

    2015-04-01

    In this work, silicon-rich oxide (SRO) films with designed thickness of 100 nm were deposited by a bipolar pulse and radio frequency magnetron co-sputtering. For comparison, the samples were then treated in a nitrogen atmosphere by conventional rapid thermal annealing (CRTA) or light-filtering rapid thermal annealing (LRTA) at 900-1100°C for 2 min. Raman spectra, grazing incident X-ray diffraction (XRD), transmission electron microscopy (TEM), Hall measurements, and current density-voltage measurements were carried out to analyze the microstructural and electrical properties of samples. Compared with the control sample using CRTA method, the crystalline volume fraction and number density of Si nanocrystals (SiNCs) in silicon oxide prepared by LRTA were greatly increased. The quantum effects of the short wave-length light (less than 800 nm) of these tungsten halogen lamps during the rapid thermal annealing process have negative effects on the formation of SiNCs in SiO2 films. SiNCs with crystal volume fraction of 73%, average size of 2.53 nm, and number density of 1.1 × 1012 cm-2 embedded in the amorphous SiO2 matrix can be formed by LRTA at 1100°C. Enhancement of more than one order of magnitude in conductivity and higher current density were obtained from the LRTA annealed sample compared to the CRTA annealed sample. The improvements in conductivity and current density were attributed to the high density SiNCs. Our results show that the LRTA method is a suitable annealing tool for the formation of SiNC in thin SiOx films.

  9. Structural colors of the SiO2/polyethyleneimine thin films on poly(ethylene terephthalate) substrates

    International Nuclear Information System (INIS)

    Jia, Yanrong; Zhang, Yun; Zhou, Qiubao; Fan, Qinguo; Shao, Jianzhong

    2014-01-01

    The SiO 2 /polyethyleneimine (PEI) films with structural colors on poly(ethylene terephthalate) (PET) substrates were fabricated by an electrostatic self-assembly method. The morphology of the films was characterized by Scanning Electron Microscopy. The results showed that there was no distinguishable multilayered structure found of SiO 2 /PEI films. The optical behaviors of the films were investigated through the color photos captured by a digital camera and the color measurement by a multi-angle spectrophotometer. Different hue and brightness were observed at various viewing angles. The structural colors were dependent on the SiO 2 particle size and the number of assembly cycles. The mechanism of the structural colors generated from the assembled films was elucidated. The morphological structures and the optical properties proved that the SiO 2 /PEI film fabricated on PET substrate formed a homogeneous inorganic/organic SiO 2 /PEI composite layer, and the structural colors were originated from single thin film interference. - Highlights: • SiO 2 /PEI thin films were electrostatic self-assembled on PET substrates. • The surface morphology and optical behavior of the film were investigated. • The structural colors varied with various SiO 2 particle sizes and assembly cycles. • Different hue and lightness of SiO 2 /PEI film were observed at various viewing angles. • Structural color of the SiO 2 /PEI film originated from single thin film interference

  10. Fabrication of an ordered mesoporous nanoparticle SiO2/Mc and their CMP of fused silica application

    Science.gov (United States)

    Xu, L.; Zou, C. L.; Zhang, X.; Kang, C. X.; Luo, G. H.; Pan, G. S.

    2018-02-01

    Here we developed an inorganic SiO2 core/mesoporous carbon shell structured (SiO2/Mc) nano-composite particle with an average size ∼50 nm as abrasives with improved dispersibility and distribution via a hydro-thermal route to obtain reserved fused silica surface and subsurface. The obtained SiO2/Mc were characterized by scanning electronic microscope. Atomic force microscopy was used to assess the surface before and after planarization. The results indicated the as-prepared SiO2/Mc composite abrasives gave a much lower surface roughness as well as lower topographical variations than that of traditional colloidal silica abrasives.

  11. Low-temperature formation of high-quality gate oxide by ultraviolet irradiation on spin-on-glass

    International Nuclear Information System (INIS)

    Usuda, R.; Uchida, K.; Nozaki, S.

    2015-01-01

    Although a UV cure was found to effectively convert a perhydropolysilazane (PHPS) spin-on-glass film into a dense SiO x film at low temperature, the electrical characteristics were never reported in order to recommend the use of PHPS as a gate-oxide material that can be formed at low temperature. We have formed a high-quality gate oxide by UV irradiation on the PHPS film, and obtained an interface midgap trap density of 3.4 × 10 11  cm −2 eV −1 by the UV wet oxidation and UV post-metallization annealing (PMA), at a temperature as low as 160 °C. In contrast to the UV irradiation using short-wavelength UV light, which is well known to enhance oxidation by the production of the excited states of oxygen, the UV irradiation was carried out using longer-wavelength UV light from a metal halide lamp. The UV irradiation during the wet oxidation of the PHPS film generates electron-hole pairs. The electrons ionize the H 2 O molecules and facilitate dissociation of the molecules into H and OH − . The OH − ions are highly reactive with Si and improve the stoichiometry of the oxide. The UV irradiation during the PMA excites the electrons from the accumulation layer, and the built-in electric field makes the electron injection into the oxide much easier. The electrons injected into the oxide recombine with the trapped holes, which have caused a large negative flat band voltage shift after the UV wet oxidation, and also ionize the H 2 O molecules. The ionization results in the electron stimulated dissociation of H 2 O molecules and the decreased interface trap density

  12. Synthesis of crystalline Ge nanoclusters in PE-CVD-deposited SiO2 films

    DEFF Research Database (Denmark)

    Leervad Pedersen, T.P.; Skov Jensen, J.; Chevallier, J.

    2005-01-01

    The synthesis of evenly distributed Ge nanoclusters in plasma-enhanced chemical-vapour-deposited (PE-CVD) SiO2 thin films containing 8 at. % Ge is reported. This is of importance for the application of nanoclusters in semiconductor technology. The average diameter of the Ge nanoclusters can...

  13. Si nanocrystals embedded in SiO2: Optical studies in the vacuum ultraviolet range

    DEFF Research Database (Denmark)

    Pankratov, V.; Osinniy, Viktor; Kotlov, A.

    2011-01-01

    Photoluminescence excitation and transmission spectra of Si nanocrystals of different diameters embedded in a SiO2 matrix have been investigated in the broad visible-vacuum ultraviolet spectral range using synchrotron radiation. The dependence of the photoluminescence excitation spectra...

  14. FeCl3.nano SiO2: An Efficient Heterogeneous Nano Catalyst for the ...

    African Journals Online (AJOL)

    NICO

    2012-05-28

    May 28, 2012 ... Solid acids have attracted much attention in organic synthesis owing to their easy work-up procedures, ... including the reaction of aryloxy magnesium halides and triethylorthoformate,13 cyclodehydration ... trichloroacetic acid,27 bismuth(III) chlo- ride,28 sulfonic acid functionalized silica (SiO2-Pr-SO3H),29.

  15. Preparation of TiO2-SiO2 composite photocatalysts for environmental applications

    Czech Academy of Sciences Publication Activity Database

    Paušová, Š.; Krýsa, J.; Jirkovský, Jaromír; Prevot, V.; Mailhot, G.

    2014-01-01

    Roč. 89, č. 8 (2014), s. 1129-1135 ISSN 0268-2575 Institutional support: RVO:61388955 Keywords : photocatalysis * TiO2/SiO2 * composite Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 2.349, year: 2014

  16. Nanoimprint lithography using TiO2-SiO2 ultraviolet curable materials

    Science.gov (United States)

    Takei, Satoshi

    2015-05-01

    Ultraviolet nanoimprint lithography has great potential for commercial device applications that are closest to production such as optical gratings, planar waveguides, photonic crystals, semiconductor, displays, solar cell panel, sensors, highbrightness LEDs, OLEDs, and optical data storage. I report and demonstrate the newly TiO2-SiO2 ultraviolet curable materials with 20-25 wt% ratio of high titanium for CF4/O2 etch selectivity using nanoimprint lithography process. The multiple structured three-dimensional micro- and nanolines patterns were observed to be successfully patterned over the large areas. The effect of titanium concentration on CF4/O2 etch selectivity with pattern transferring carbon layer imprinting time was investigated. CF4/O2 etching rate of the TiO2-SiO2 ultraviolet curable material was approximately 3.8 times lower than that of the referenced SiO2 sol-gel ultraviolet curable material. The TiO2-SiO2 ultraviolet curable material with high titanium concentration has been proved to be versatile in advanced nanofabrication.

  17. Theory of Al2O3 incorporation in SiO2

    DEFF Research Database (Denmark)

    Lægsgaard, Jesper

    2002-01-01

    Different possible forms of Al2O3 units in a SiO2 network are studied theoretically within the framework of density-functional theory. Total-energy differences between the various configurations are obtained, and simple thermodynamical arguments are used to provide an estimate of their relative...

  18. Electrical impedance spectroscopic investigations of monodispersed SiO2 nanospheres

    Science.gov (United States)

    Sakthisabarimoorthi, A.; Martin Britto Dhas, S. A.; Jose, M.

    2018-01-01

    Dielectric analysis of uniform and monodispersed SiO2 nanospheres at various temperatures in the frequency range 1 Hz-1 MHz is reported. The high optical transmittance and the presence of silica network in the synthesized product are evident from UV-vis and FTIR spectroscopic techniques respectively. The amorphous structure of SiO2 nanospheres is investigated by powder XRD pattern and uniform spherical morphology is visualized by FESEM analysis. The X-ray photoelectron spectroscopy elucidated the exact valence states of the SiO2 nanospheres. The temperature dependent dielectric parameters such as, dielectric constant (εr) and loss factor (tan δ) are decreased with increasing applied frequency and became static at higher frequencies. SiO2 nanospheres exhibited high dielectric constant (εr = 68) and low loss factor (tan δ = 0.0079) at 40 °C at 1 MHz. The activation energy (Ea) and relaxation time constant (τ) are calculated and the equivalent circuit model is developed to describe the electrical behaviour of the material.

  19. CoFe2O4-SiO2 Composites: Preparation and Magnetodielectric Properties

    Directory of Open Access Journals (Sweden)

    T. Ramesh

    2016-01-01

    Full Text Available Cobalt ferrite (CoFe2O4 and silica (SiO2 nanopowders have been prepared by the microwave hydrothermal (M-H method using metal nitrates as precursors of CoFe2O4 and tetraethyl orthosilicate as a precursor of SiO2. The synthesized powders were characterized by XRD and FESEM. The (100-x (CoFe2O4 + xSiO2 (where x = 0%, 10%, 20%, and 30% composites with different weight percentages have been prepared using ball mill method. The composite samples were sintered at 800°C/60 min using the microwave sintering method and then their structural and morphological studies were investigated using X-ray diffraction (XRD, Fourier transformation infrared (FTIR spectra, and scanning electron microscopy (SEM, respectively. The effect of SiO2 content on the magnetic and electrical properties of CoFe2O4/SiO2 nanocomposites has been studied via the magnetic hysteresis loops, complex permeability, permittivity spectra, and DC resistivity measurements. The synthesized nanocomposites with adjustable grain sizes and controllable magnetic properties make the applicability of cobalt ferrite even more versatile.

  20. SiO2 Glass Density to Lower-Mantle Pressures

    DEFF Research Database (Denmark)

    Petitgirard, Sylvain; Malfait, Wim J.; Journaux, Baptiste

    2017-01-01

    and present Earth. SiO2 is the main constituent of Earth's mantle and is the reference model system for the behavior of silicate melts at high pressure. Here, we apply our recently developed x-ray absorption technique to the density of SiO2 glass up to 110 GPa, doubling the pressure range...... for such measurements. Our density data validate recent molecular dynamics simulations and are in good agreement with previous experimental studies conducted at lower pressure. Silica glass rapidly densifies up to 40 GPa, but the density trend then flattens to become asymptotic to the density of SiO2 minerals above 60...... GPa. The density data present two discontinuities at similar to 17 and similar to 60 GPa that can be related to a silicon coordination increase from 4 to a mixed 5/6 coordination and from 5/6 to sixfold, respectively. SiO2 glass becomes denser than MgSiO3 glass at similar to 40 GPa, and its density...

  1. Friction and wear studies on nylon-6/SiO2 nanocomposites

    NARCIS (Netherlands)

    de la Luz Garcia-Curiel, M.M.; de Rooij, Matthias B.; Winnubst, Aloysius J.A.; van Zyl, W.E.; Verweij, H.

    2004-01-01

    Composites of nanometer-sized silica (SiO2) filler incorporated in nylon-6 polymer were prepared by compression molding. Their friction and wear properties were investigated on a pin on disk tribometer by running a flat pin of steel against a composite disc. The morphologies of the composites as

  2. Enhanced field emission properties of carbon nanotube bundles confined in SiO2 pits

    Science.gov (United States)

    Lim, Yu Dian; Grapov, Dmitry; Hu, Liangxing; Kong, Qinyu; Tay, Beng Kang; Labunov, Vladimir; Miao, Jianmin; Coquet, Philippe; Aditya, Sheel

    2018-02-01

    It has been widely reported that carbon nanotubes (CNTs) exhibit superior field emission (FE) properties due to their high aspect ratios and unique structural properties. Among the various types of CNTs, random growth CNTs exhibit promising FE properties due to their reduced inter-tube screening effect. However, growing random growth CNTs on individual catalyst islands often results in spread out CNT bundles, which reduces overall field enhancement. In this study, significant improvement in FE properties in CNT bundles is demonstrated by confining them in microfabricated SiO2 pits. Growing CNT bundles in narrow (0.5 μm diameter and 2 μm height) SiO2 pits achieves FE current density of 1–1.4 A cm‑2, which is much higher than for freestanding CNT bundles (76.9 mA cm‑2). From the Fowler Nordheim plots, confined CNT bundles show a higher field enhancement factor. This improvement can be attributed to the reduced bundle diameter by SiO2 pit confinement, which yields bundles with higher aspect ratios. Combining the obtained outcomes, it can be conclusively summarized that confining CNTs in SiO2 pits yields higher FE current density due to the higher field enhancement of confined CNTs.

  3. Nano-TiCl4/SiO2: An efficient heterogeneous solid acid catalyst for ...

    Indian Academy of Sciences (India)

    Abstract. Nano-TiCl4/SiO2 was found to be an inexpensive and efficient heterogeneous solid acid catalyst for the synthesis of one-pot cascade synthesis of highly functionalized asymmetric tetrahydropyridines from the five-component condensation reaction of the para-substituted anilines and aromatic aldehydes with ethyl.

  4. Synthesis and characterization of silica–gold core-shell (SiO2@Au ...

    Indian Academy of Sciences (India)

    Synthesis and characterization of silica–gold core-shell (SiO2@Au) nanoparticles. DEEPIKA KANDPAL. 1,∗. , SUCHITA KALELE. 2 and S K KULKARNI. 2. 1. Department of Physics, G.B. Pant University of Agriculture & Technology,. Pantnagar 263 145, India. 2. Department of Physics, University of Pune, Pune 411 007, ...

  5. A microbiological evaluation of SiO2-coated textiles in hospital interiors

    DEFF Research Database (Denmark)

    Mogensen, Jeppe; Jørgensen, Poul-Erik; Thomsen, Trine Rolighed

    2016-01-01

    contact plates through a three-week period. By determining the level of contamination on these surfaces, the study illustrates that the SiO2-coated textile is possible to clean to an acceptable level below the critical limit value of 2,5 Colony Forming Units (CFU) per cm2. In comparison, the traditional...

  6. Hazards of TiO2 and amorphous SiO2 nanoparticles

    NARCIS (Netherlands)

    Reijnders, L.; Kahn, H.A.; Arif, I.A.

    2012-01-01

    TiO2 and amorphous SiO2 nanoparticles have been described as ‘safe’, ‘non-toxic’ and ‘environment friendly’ in scientific literature. However, though toxicity data are far from complete, there is evidence that these nanoparticles are hazardous. TiO2 nanoparticles have been found hazardous to humans

  7. Ti-catalyzed HfSiO4 formation in HfTiO4 films on SiO2 studied by Z-contrast scanning electron microscopy

    Directory of Open Access Journals (Sweden)

    Elizabeth Ellen Hoppe

    2013-08-01

    Full Text Available Hafnon (HfSiO4 as it is initially formed in a partially demixed film of hafnium titanate (HfTiO4 on fused SiO2 is studied by atomic number (Z contrast high resolution scanning electron microscopy, x-ray diffraction, and Raman spectroscopy and microscopy. The results show exsoluted Ti is the catalyst for hafnon formation by a two-step reaction. Ti first reacts with SiO2 to produce a glassy Ti-silicate. Ti is then replaced by Hf in the silicate to produce HfSiO4. The results suggest this behavior is prototypical of other Ti-bearing ternary or higher order oxide films on SiO2 when film thermal instability involves Ti exsolution.

  8. Fabrication of Core-Shell Structural SiO2@H3[PM12O40] Material and Its Catalytic Activity

    Directory of Open Access Journals (Sweden)

    Xin Yang

    2014-01-01

    Full Text Available Through a natural tree grain template and sol-gel technology, the heterogeneous catalytic materials based on polyoxometalate compounds H3[PM12O40] encapsulating SiO2: SiO2@H3[PM12O40] (SiO2@PM12, M = W, Mo with core-shell structure had been prepared. The structure and morphology of the core-shell microspheres were characterized by the XRD, IR spectroscopy, UV-Vis absorbance, and SEM. These microsphere materials can be used as heterogeneous catalysts with high activity and stability for catalytic wet air oxidation of pollutant dyes safranine T (ST at room condition. The results show that the catalysts have excellent catalytic activity in treatment of wastewater containing 10 mg/L ST, and 94% of color can be removed within 60 min. Under different cycling runs, it is shown that the catalysts are stable under such operating conditions and the leaching tests show negligible leaching effect owing to the lesser dissolution.

  9. Efficient photocatalytic activity with carbon-doped SiO2 nanoparticles

    KAUST Repository

    Zhang, Dongen

    2013-01-01

    Photocatalysis provides a \\'green\\' approach to completely eliminate various kinds of contaminants that are fatal for current environmental and energy issues. Semiconductors are one of the most frequently used photocatalysts as they can absorb light over a wide spectral range. However, it is also well known that naked SiO2 is not an efficient photocatalyst due to its relatively large band gap, which could only absorb shortwave ultraviolet light. In this report, nanoscale particles of carbon-doped silicon dioxide (C-doped SiO2) for use in photocatalysis were successfully prepared by a facile one-pot thermal process using tetraethylorthosilicate (TEOS) as the source of both silicon and carbon. These particles were subsequently characterized by thermogravimetric analysis, X-ray diffraction, standard and high resolution transmission electron microscopy and X-ray photoelectron spectroscopy. The C-doped SiO2 displayed outstanding photocatalytic properties, as evidenced by its catalysis of Rhodamine B degradation under near-UV irradiation. We propose that carbon doping of the SiO2 lattice creates new energy states between the bottom of the conduction band and the top of the valence band, which narrows the band gap of the material. As a result, the C-doped SiO2 nanoparticles exhibit excellent photocatalytic activities in a neutral environment. The novel synthesis reported herein for this material is both energy efficient and environmentally friendly and as such shows promise as a technique for low-cost, readily scalable industrial production. © 2013 The Royal Society of Chemistry.

  10. Ultrathin Microporous SiO2 Membranes Photodeposited on Hydrogen Evolving Catalysts Enabling Overall Water Splitting

    KAUST Repository

    Bau, Jeremy A.

    2017-10-17

    Semiconductor systems for photocatalytic overall water splitting into H2 and O2 gases typically require metal cocatalyst particles, such as Pt, to efficiently catalyze H2 evolution. However, such metal catalyst surfaces also serve as recombination sites for H2 and O2, forming H2O. We herein report the photon-induced fabrication of microporous SiO2 membranes that can selectively restrict passage of O2 and larger hydrated ions while allowing penetration of protons, water, and H2. The SiO2 layers were selectively photodeposited on Pt nanoparticles on SrTiO3 photocatalyst by using tetramethylammonium (TMA) as a structure-directing agent (SDA), resulting in the formation of core–shell Pt@SiO2 cocatalysts. The resulting photocatalyst exhibited both improved overall water splitting performance under irradiation and with no H2/O2 recombination in the dark. The function of the SiO2 layers was investigated electrochemically by fabricating the SiO2 layers on a Pt electrode via an analogous cathodic deposition protocol. The uniform, dense, yet amorphous layers possess microporosity originating from ring structures formed during the hydrolysis of the silicate precursor in the presence of TMA, suggesting a double-role for TMA in coordinating silicate to cathodic surfaces and in creating a microporous material. The resulting layers were able to function as a molecular sieve, allowing for exclusive H2 generation while excluding unwanted side reactions by O2 or ferricyanide. The SiO2 layer is stable for extended periods of time in photocatalytic conditions, demonstrating promise as a nontoxic material for selective H2 evolution.

  11. Fabrication of hybrid self-assembled monolayer/hafnium oxide gate dielectric by radical oxidation for molybdenum disulfide field-effect transistors

    Science.gov (United States)

    Kawanago, Takamasa; Ikoma, Ryo; Oba, Tomoaki; Takagi, Hiroyuki

    2017-11-01

    In this study, radical oxidation is applied to the fabrication of a hybrid self-assembled monolayer (SAM)/hafnium oxide (HfOx) gate dielectric in molybdenum disulfide (MoS2) field-effect transistors. The fabrication process involves radical oxidation to form HfOx at the surface of metallic HfN, SAM formation by immersion, and the deterministic transfer of MoS2 flakes. A subthreshold slope of 75 mV/dec and small hysteresis were demonstrated, indicating superior interfacial properties. Cross-sectional transmission electron microscopy revealed the uniform formation of the HfOx layer at the surface of HfN. The SAM is indispensable for the superior interfacial properties in MoS2 field-effect transistors. The radical oxidation is not restricted to the oxidation of silicon and germanium substrates and was also found to be applicable to the fabrication of a high-k gate dielectric. This study opens up interesting possibilities of radical oxidation for research on functional electronic devices.

  12. Understanding the Structure of High-K Gate Oxides - Oral Presentation

    Energy Technology Data Exchange (ETDEWEB)

    Miranda, Andre [SLAC National Accelerator Lab., Menlo Park, CA (United States)

    2015-08-25

    Hafnium Oxide (HfO2) amorphous thin films are being used as gate oxides in transistors because of their high dielectric constant (κ) over Silicon Dioxide. The present study looks to find the atomic structure of HfO2 thin films which hasn’t been done with the technique of this study. In this study, two HfO2 samples were studied. One sample was made with thermal atomic layer deposition (ALD) on top of a Chromium and Gold layer on a silicon wafer. The second sample was made with plasma ALD on top of a Chromium and Gold layer on a Silicon wafer. Both films were deposited at a thickness of 50nm. To obtain atomic structure information, Grazing Incidence X-ray diffraction (GIXRD) was carried out on the HfO2 samples. Because of this, absorption, footprint, polarization, and dead time corrections were applied to the scattering intensity data collected. The scattering curves displayed a difference in structure between the ALD processes. The plasma ALD sample showed the broad peak characteristic of an amorphous structure whereas the thermal ALD sample showed an amorphous structure with characteristics of crystalline materials. This appears to suggest that the thermal process results in a mostly amorphous material with crystallites within. Further, the scattering intensity data was used to calculate a pair distribution function (PDF) to show more atomic structure. The PDF showed atom distances in the plasma ALD sample had structure up to 10 Å, while the thermal ALD sample showed the same structure below 10 Å. This structure that shows up below 10 Å matches the bond distances of HfO2 published in literature. The PDF for the thermal ALD sample also showed peaks up to 20 Å, suggesting repeating atomic spacing outside the HfO2 molecule in the sample. This appears to suggest that there is some crystalline structure within the thermal ALD sample.

  13. Epitaxial ZnO gate dielectrics deposited by RF sputter for AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors

    Science.gov (United States)

    Yoon, Seonno; Lee, Seungmin; Kim, Hyun-Seop; Cha, Ho-Young; Lee, Hi-Deok; Oh, Jungwoo

    2018-01-01

    Radio frequency (RF)-sputtered ZnO gate dielectrics for AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors (MOS-HEMTs) were investigated with varying O2/Ar ratios. The ZnO deposited with a low oxygen content of 4.5% showed a high dielectric constant and low interface trap density due to the compensation of oxygen vacancies during the sputtering process. The good capacitance-voltage characteristics of ZnO-on-AlGaN/GaN capacitors resulted from the high crystallinity of oxide at the interface, as investigated by x-ray diffraction and high-resolution transmission electron microscopy. The MOS-HEMTs demonstrated comparable output electrical characteristics with conventional Ni/Au HEMTs but a lower gate leakage current. At a gate voltage of -20 V, the typical gate leakage current for a MOS-HEMT with a gate length of 6 μm and width of 100 μm was found to be as low as 8.2 × 10-7 mA mm-1, which was three orders lower than that of the Ni/Au Schottky gate HEMT. The reduction of the gate leakage current improved the on/off current ratio by three orders of magnitude. These results indicate that RF-sputtered ZnO with a low O2/Ar ratio is a good gate dielectric for high-performance AlGaN/GaN MOS-HEMTs.

  14. Effects of Mev Si Ions and Thermal Annealing on Thermoelectric and Optical Properties of SiO2/SiO2+Ge Multi-nanolayer thin Films

    Science.gov (United States)

    Budak, S.; Alim, M. A.; Bhattacharjee, S.; Muntele, C.

    Thermoelectric generator devices have been prepared from 200 alternating layers of SiO2/SiO2+Ge superlattice films using DC/RF magnetron sputtering. The 5 MeV Si ionsbombardmenthasbeen performed using the AAMU Pelletron ion beam accelerator to formquantum dots and / or quantum clusters in the multi-layer superlattice thin films to decrease the cross-plane thermal conductivity, increase the cross-plane Seebeck coefficient and increase the cross-plane electrical conductivity to increase the figure of merit, ZT. The fabricated devices have been annealed at the different temperatures to tailor the thermoelectric and optical properties of the superlattice thin film systems. While the temperature increased, the Seebeck coefficient continued to increase and reached the maximum value of -25 μV/K at the fluenceof 5x1013 ions/cm2. The decrease in resistivity has been seen between the fluence of 1x1013 ions/cm2 and 5x1013 ions/cm2. Transport properties like Hall coefficient, density and mobility did not change at all fluences. Impedance spectroscopy has been used to characterize the multi-junction thermoelectric devices. The loci obtained in the C*-plane for these data indicate non-Debye type relaxation displaying the presence of the depression parameter.

  15. Electro-oxidized epitaxial graphene channel field-effect transistors with single-walled carbon nanotube thin film gate electrode.

    Science.gov (United States)

    Ramesh, Palanisamy; Itkis, Mikhail E; Bekyarova, Elena; Wang, Feihu; Niyogi, Sandip; Chi, Xiaoliu; Berger, Claire; de Heer, Walt; Haddon, Robert C

    2010-10-20

    We report the effect of electrochemical oxidation in nitric acid on the electronic properties of epitaxial graphene (EG) grown on silicon carbide substrates; we demonstrate the availability of an additional reaction channel in EG, which is not present in graphite but which facilitates the introduction of the reaction medium into the graphene galleries during electro-oxidation. The device performance of the chemically processed graphene was studied by patterning the EG wafers with two geometrically identical macroscopic channels; the electro-oxidized channel showed a logarithmic increase of resistance with decreasing temperature, which is ascribed to the scattering of charge carriers in a two-dimensional electronic gas, rather than the presence of an energy gap at the Fermi level. Field-effect transistors were fabricated on the electro-oxidized and pristine graphene channels using single-walled carbon nanotube thin film top gate electrodes, thereby allowing the study of the effect of oxidative chemistry on the transistor performance of EG. The electro-oxidized channel showed higher values for the on-off ratio and the mobility of the graphene field-effect transistor, which we ascribe to the availability of high-quality internal graphene layers after electro-oxidation of the more defective top layers. Thus, the present oxidative process provides a clear contrast with previously demonstrated covalent chemistry in which sp(3) hybridized carbon atoms are introduced into the graphitic transport layer of the lattice by carbon-carbon bond formation, thereby opening an energy gap.

  16. Ethanol-to-Butadiene Conversion over SiO2-MgO Catalysts: Synthesis-Structure-Performance Relationships

    NARCIS (Netherlands)

    Angelici, C.

    2015-01-01

    The work presented in this PhD Thesis provides new insights into the underlying reasons that make SiO2-MgO materials excellent catalysts for the ethanol-to-butadiene Lebedev process. In particular, the preparation technique of choice affects the structural properties of the resulting SiO2-MgO

  17. The electrorheological properties of nano-sized SiO2 particle materials doped with rare earths

    International Nuclear Information System (INIS)

    Liu Yang; Liao Fuhui; Li Junran; Zhang Shaohua; Chen Shumei; Wei Chenguan; Gao Song

    2006-01-01

    Electrorheological (ER) materials of pure SiO 2 and SiO 2 doped with rare earths (RE = Ce, Gd, Y) (non-metallic glasses (silicates)) were prepared using Na 2 SiO 3 and RECl 3 as starting materials. The electrorheological properties are not enhanced by all rare earth additions. The material doped with Ce exhibits the best ER performance

  18. Sensitizing effects of ZnO quantum dots on red-emitting Pr3+-doped SiO2 phosphor

    CSIR Research Space (South Africa)

    Mbule, PS

    2012-05-01

    Full Text Available In this study, red cathodoluminescence (CL) ( emission=614 nm) was observed from Pr3+ ions in a glassy (amorphous) SiO2 host. This emission was enhanced considerably when ZnO quantum dots (QDs) were incorporated in the SiO2:Pr3+ suggesting...

  19. Preparation of Raspberry-like Superhydrophobic SiO2 Particles by Sol-gel Method and Its Potential Applications

    Directory of Open Access Journals (Sweden)

    Xu Gui-Long

    2011-12-01

    Full Text Available Raspberry‐like SiO2 particles with a nano‐micro‐binary structure were prepared by a simple sol‐gel method using tetraethoxysilane (TEOS and methyltriethoxysilane (MTES as precursors. The chemical components and morphology of the SiO2 particles were characterized by Fourier transform infrared spectroscopy (FT‐IR and a Transmission electron microscope (TEM. The surface topography and wetting behaviour of the raspberry‐like SiO2 surface were observed with a Scanning electron microscope (SEM and studied by the water/oil contact angle (CA, respectively. The thermal stability of the prepared SiO2 particles was characterized by TGA analysis. The results show that the highly dispersed SiO2 particles initially prepared by the sol‐gel method turn into raspberry‐like particles with during the aging process. The raspberry‐like SiO2 particles show superhydrophobicity and superoleophilicity across a wide range of pH values. The SiO2 particles were thermally stable up to 475°C, while above this temperature the hydrophobicity decreases and finally becomes superhydrophobic when the temperature reaches 600°C. The raspberry‐like SiO2 particles which were prepared have potential applications in the fields of superhydrophobic surfaces, water‐oil separation, anti‐corrosion and fluid transportation.

  20. vapor phase lubrication of SiO2 surfaces via adsorption of short chain linear alcohols & a sum frequency generation vibration spectroscopy study of crystalline cellulose in biomass

    Science.gov (United States)

    Barnette, Anna Lorraine

    The use of silicon oxide with its native oxide layer for the fabrication of microelectromechanical systems (MEMS) with contacting sliding parts requires the need for innovative lubrication methods to extend device lifetimes. The most promising method to date involves the equilibrium vapor phase lubrication (VPL) of MEMS using short chain linear alcohols in ambient conditions. Still, some questions remain regarding the effectiveness of this lubrication method, these include (1) whether or not the adsorbed n-alcohol molecules are the primary lubricant and (2) is this lubrication method effective in humid environments. This study investigates the vapor phase lubrication of SiO2 surfaces using short chain linear alcohols, more specifically n-propanol and n-pentanol. Macro-scale ball-on-flat tribometer tests are used to evaluate the lubriciousness of n-pentanol vapor under a series of contact loads/ pressures. Wear reduction of the SiO2 surfaces is achieved when there is complete coverage of the SiO2 surfaces with the adsorbed n-pentanol molecules. This occurs when the partial pressure relative to the saturation pressure (P/Psat) of n-pentanol was kept above 20% P/Psat which corresponds to approximately monolayer coverage of the SiO2 surface. In contrast to the lubricious effect of n-pentanol vapor, water vapor proves to enhance wear of the SiO2 surfaces when compared to dry (low moisture) conditions. This study also demonstrates that the primary lubrication method of the SiO 2 surfaces is most likely the adsorbed n-pentanol molecules and not the tribochemical reaction species produced during the sliding contact. Although this reaction species is always present within the wear tested regions, the production of the tribochemical reaction species is enhanced when more severe wear is observed. So, the adsorbed n-pentanol molecules are the primary method of lubrication. The effectiveness of the lubrication method in environments containing water vapor is also investigated

  1. BE-SONOS flash memory along with metal gate and high-k dielectrics in tunnel barrier and its impact on charge retention dynamics

    Science.gov (United States)

    Jain, Sonal; Gupta, Deepika; Neema, Vaibhav; Vishwakarma, Santosh

    2016-03-01

    We investigate the effect of a high-k dielectric in the tunnel layer to improve the erase speed-retention trade-off. Here, the proposed stack in the tunnel layer is AlLaO3/HfAlO/SiO2. These proposed materials possess low valence band offset with high permittivity to improve both the erase speed and retention time in barrier engineered silicon-oxide-nitride-oxide-silicon (BE-SONOS). In the proposed structure HfAlO and AlLaO3 replace Si3N4 and the top SiO2 layer in a conventional oxide/nitride/oxide (ONO) tunnel stack. Due to the lower conduction band offset (CBO) and high permittivity of the proposed material in the tunnel layer, it offers better program/erase (P/E) speed and retention time. In this work the gate length is also scaled down from 220 to 55 nm to observe the effect of high-k materials while scaling, for the same equivalent oxide thickness (EOT). We found that the scaling down of the gate length has a negligible impact on the memory window of the devices. Hence, various investigated tunnel oxide stacks possess a good memory window with a charge retained up to 87.4% (at room temperature) after a period of ten years. We also examine the use of a metal gate instead of a polysilicon gate, which shows improved P/E speed and retention time.

  2. BE-SONOS flash memory along with metal gate and high-k dielectrics in tunnel barrier and its impact on charge retention dynamics

    International Nuclear Information System (INIS)

    Jain, Sonal; Neema, Vaibhav; Gupta, Deepika; Vishwakarma, Santosh

    2016-01-01

    We investigate the effect of a high-k dielectric in the tunnel layer to improve the erase speed-retention trade-off. Here, the proposed stack in the tunnel layer is AlLaO 3 /HfAlO/SiO 2 . These proposed materials possess low valence band offset with high permittivity to improve both the erase speed and retention time in barrier engineered silicon-oxide-nitride-oxide-silicon (BE-SONOS). In the proposed structure HfAlO and AlLaO 3 replace Si 3 N 4 and the top SiO 2 layer in a conventional oxide/nitride/oxide (ONO) tunnel stack. Due to the lower conduction band offset (CBO) and high permittivity of the proposed material in the tunnel layer, it offers better program/erase (P/E) speed and retention time. In this work the gate length is also scaled down from 220 to 55 nm to observe the effect of high-k materials while scaling, for the same equivalent oxide thickness (EOT). We found that the scaling down of the gate length has a negligible impact on the memory window of the devices. Hence, various investigated tunnel oxide stacks possess a good memory window with a charge retained up to 87.4% (at room temperature) after a period of ten years. We also examine the use of a metal gate instead of a polysilicon gate, which shows improved P/E speed and retention time. (paper)

  3. Long-Term Synaptic Plasticity Emulated in Modified Graphene Oxide Electrolyte Gated IZO-Based Thin-Film Transistors.

    Science.gov (United States)

    Yang, Yi; Wen, Juan; Guo, Liqiang; Wan, Xiang; Du, Peifu; Feng, Ping; Shi, Yi; Wan, Qing

    2016-11-09

    Emulating neural behaviors at the synaptic level is of great significance for building neuromorphic computational systems and realizing artificial intelligence. Here, oxide-based electric double-layer (EDL) thin-film transistors were fabricated using 3-triethoxysilylpropylamine modified graphene oxide (KH550-GO) electrolyte as the gate dielectrics. Resulting from the EDL effect and electrochemical doping between mobile protons and the indium-zinc-oxide channel layer, long-term synaptic plasticity was emulated in our devices. Synaptic functions including long-term memory, synaptic temporal integration, and dynamic filters were successfully reproduced. In particular, spike rate-dependent plasticity (SRDP), one of the basic learning rules of long-term plasticity in the neural network where the synaptic weight changes according to the rate of presynaptic spikes, was emulated in our devices. Our results may facilitate the development of neuromorphic computational systems.

  4. Thermally tunable VO2-SiO2 nanocomposite thin-film capacitors

    Science.gov (United States)

    Sun, Yifei; Narayanachari, K. V. L. V.; Wan, Chenghao; Sun, Xing; Wang, Haiyan; Cooley, Kayla A.; Mohney, Suzanne E.; White, Doug; Duwel, Amy; Kats, Mikhail A.; Ramanathan, Shriram

    2018-03-01

    We present a study of co-sputtered VO2-SiO2 nanocomposite dielectric thin-film media possessing continuous temperature tunability of the dielectric constant. The smooth thermal tunability is a result of the insulator-metal transition in the VO2 inclusions dispersed within an insulating matrix. We present a detailed comparison of the dielectric characteristics of this nanocomposite with those of a VO2 control layer and of VO2/SiO2 laminate multilayers of comparable overall thickness. We demonstrated a nanocomposite capacitor that has a thermal capacitance tunability of ˜60% between 25 °C and 100 °C at 1 MHz, with low leakage current. Such thermally tunable capacitors could find potential use in applications such as sensing, thermal cloaks, and phase-change energy storage devices.

  5. Versatile superamphiphobic cotton fabrics fabricated by coating with SiO2/FOTS

    Science.gov (United States)

    Li, Deke; Guo, Zhiguang

    2017-12-01

    A multifunctional superamphiphobic cotton fabric was fabricated by coating silica nanoparticles on the cotton fabric surface and further modification by 1H,1H,2H,2H-perfluorooctyltrichlorosilane (FOTS). The fluctuant woven fabric and the fluffy spherical SiO2 nanoparticles constructed a dual micro/nano-structures. The surface free energy of the fabric composite was reduced by FOTS modifier. The interplay of the structured and perfluorinated SiO2 nanoparticles could not only endow the fabric highly liquid repellent ability, but could also to enhance the coating stability. The prepared cotton fabrics exhibited high liquid repellency to water, colza oil and n-hexadecane with lower surface tension, showing a contact angle of 158°, 152°, and 153°, respectively. The results demonstrated that superamphiphobic cotton fabric possessed desirable chemical and mechanical durability, self-cleaning and self-healing property, the robust and multifunctional fabric would find innovative opportunities for practical applications.

  6. Enhanced formation of Ge nanocrystals in Ge : SiO2 layers by swift heavy ions

    International Nuclear Information System (INIS)

    Antonova, I V; Volodin, V A; Marin, D M; Skuratov, V A; Smagulova, S A; Janse van Vuuren, A; Neethling, J; Jedrzejewski, J; Balberg, I

    2012-01-01

    In this paper we report the ability of swift heavy Xe ions with an energy of 480 MeV and a fluence of 10 12 cm -2 to enhance the formation of Ge nanocrystals within SiO 2 layers with variable Ge contents. These Ge-SiO 2 films were fabricated by the co-sputtering of Ge and quartz sources which followed various annealing procedures. In particular, we found that the irradiation of the Ge : SiO 2 films with subsequent annealing at 500 °C leads to the formation of a high concentration of nanocrystals (NCs) with a size of 2-5 nm, whereas without irradiation only amorphous inclusions were observed. This effect, as evidenced by Raman spectra, is enhanced by pre-irradiation at 550 °C and post-irradiation annealing at 600 °C, which also leads to the observation of room temperature visible photoluminescence. (paper)

  7. Electron irradiation response on Ge and Al-doped SiO 2 optical fibres

    Science.gov (United States)

    Yaakob, N. H.; Wagiran, H.; Hossain, I.; Ramli, A. T.; Bradley, D. A.; Hashim, S.; Ali, H.

    2011-05-01

    This paper describes the thermoluminescence response, sensitivity, stability and reproducibility of SiO 2 optical fibres with various electron energies and doses. The TL materials that comprise Al- and Ge-doped silica fibres were used in this experiment. The TL results are compared with those of the commercially available TLD-100. The doped SiO 2 optical fibres and TLD-100 are placed in a solid phantom and irradiated with 6, 9 and 12 MeV electron beams at doses ranging from 0.2 to 4.0 Gy using the LINAC at Hospital Sultan Ismail, Johor Bahru, Malaysia. It was found that the commercially available Al- and Ge-doped optical fibres have a linear dose-TL signal relationship. The intensity of TL response of Ge-doped fibre is markedly greater than that of the Al-doped fibre.

  8. Microwave absorption properties and mechanism of cagelike ZnO /SiO2 nanocomposites

    Science.gov (United States)

    Cao, Mao-Sheng; Shi, Xiao-Ling; Fang, Xiao-Yong; Jin, Hai-Bo; Hou, Zhi-Ling; Zhou, Wei; Chen, Yu-Jin

    2007-11-01

    In this paper, cagelike ZnO /SiO2 nanocomposites were prepared and their microwave absorption properties were investigated in detail. Dielectric constants and losses of the pure cagelike ZnO nanostructures were measured in a frequency range of 8.2-12.4GHz. The measured results indicate that the cagelike ZnO nanostructures are low-loss material for microwave absorption in X band. However, the cagelike ZnO /SiO2 nanocomposites exhibit a relatively strong attenuation to microwave in X band. Such strong absorption is related to the unique geometrical morphology of the cagelike ZnO nanostructures in the composites. The microcurrent network can be produced in the cagelike ZnO nanostructures, which contributes to the conductive loss.

  9. Atmospheric Plasma Deposition of SiO2 Films for Adhesion Promoting Layers on Titanium

    Directory of Open Access Journals (Sweden)

    Liliana Kotte

    2014-12-01

    Full Text Available This paper evaluates the deposition of silica layers at atmospheric pressure as a pretreatment for the structural bonding of titanium (Ti6Al4V, Ti15V3Cr3Sn3Al in comparison to an anodizing process (NaTESi process. The SiO2 film was deposited using the LARGE plasma source, a linearly extended DC arc plasma source and applying hexamethyldisiloxane (HMDSO as a precursor. The morphology of the surface was analyzed by means of SEM, while the characterization of the chemical composition of deposited plasma layers was done by XPS and FTIR. The long-term durability of bonded samples was evaluated by means of a wedge test in hot/wet condition. The almost stoichiometric SiO2 film features a good long-term stability and a high bonding strength compared to the films produced with the wet-chemical NaTESi process.

  10. Fourier transform infrared spectroscopic study of gamma irradiated SiO2 nanoparticles

    Science.gov (United States)

    Huseynov, Elchin; Garibov, Adil; Mehdiyeva, Ravan; Huseynova, Efsane

    2018-03-01

    In the present work, nano SiO2 particles are investigated before and after gamma irradiation (25, 50, 75, 100 and 200 kGy) using Fourier transform infrared (FTIR) spectroscopy method for the wavenumber between 400-4000 cm-1. It is found that as a result of spectroscopic analysis, five new peaks have appeared after gamma radiation. Two of new obtained peaks (which are located at 687 cm-1 and 2357 cm-1 of wavenumber) were formed as a result of gamma radiation interaction with Si-O bonds. Another three new peaks (peaks appropriate to 941, 2052 and 2357 cm-1 values of wavenumber) appear as a result of interaction of water with nano SiO2 particles after gamma irradiation. It has been defined as asymmetrical bending vibration, symmetrical bending vibration, symmetrical stretching vibration and asymmetrical stretching vibration of Si-O bonds appropriate to peaks.

  11. Preparation of Mesoporous SiO2-Pillared Lamellar Titanoniobate Catalysts for Bioethanol Dehydration

    Directory of Open Access Journals (Sweden)

    Olivalter Pergentino

    2014-01-01

    Full Text Available The lamellar perovskite K0,8Ti0,8Nb1,2O5 was prepared by solid state reaction, and its protonic form was used in a sequence of intercalation steps with n-butylamine, cetyltrimethylammonium bromide (CTABr, and tetraethyl orthosilicate (TEOS. After calcination, a high surface area, mesoporous SiO2-pillared titanoniobate, was obtained. The samples were characterized by XRD, EDX, TG-DTG, N2 adsorption isotherms, and NH3-TPD. The pillarization procedure affected the textural properties, the amount, and strength distribution of acid sites. The influence of the pillarization procedure on the catalytic properties of the lamellar titanoniobates was investigated on ethanol dehydration. High ethanol conversions and ethylene yields (>90% were obtained in the presence of the SiO2-pillared titanoniobate catalyst, at 350–450°C.

  12. Electron irradiation response on Ge and Al-doped SiO2 optical fibres

    International Nuclear Information System (INIS)

    Yaakob, N.H.; Wagiran, H.; Hossain, I.; Ramli, A.T.; Bradley, D.A; Hashim, S.; Ali, H.

    2011-01-01

    This paper describes the thermoluminescence response, sensitivity, stability and reproducibility of SiO 2 optical fibres with various electron energies and doses. The TL materials that comprise Al- and Ge-doped silica fibres were used in this experiment. The TL results are compared with those of the commercially available TLD-100. The doped SiO 2 optical fibres and TLD-100 are placed in a solid phantom and irradiated with 6, 9 and 12 MeV electron beams at doses ranging from 0.2 to 4.0 Gy using the LINAC at Hospital Sultan Ismail, Johor Bahru, Malaysia. It was found that the commercially available Al- and Ge-doped optical fibres have a linear dose-TL signal relationship. The intensity of TL response of Ge-doped fibre is markedly greater than that of the Al-doped fibre.

  13. Formation of nucleoplasmic protein aggregates impairs nuclear function in response to SiO2 nanoparticles

    International Nuclear Information System (INIS)

    Chen Min; Mikecz, Anna von

    2005-01-01

    Despite of their exponentially growing use, little is known about cell biological effects of nanoparticles. Here, we report uptake of silica (SiO 2 ) nanoparticles to the cell nucleus where they induce aberrant clusters of topoisomerase I (topo I) in the nucleoplasm that additionally contain signature proteins of nuclear domains, and protein aggregation such as ubiquitin, proteasomes, cellular glutamine repeat (polyQ) proteins, and huntingtin. Formation of intranuclear protein aggregates (1) inhibits replication, transcription, and cell proliferation; (2) does not significantly alter proteasomal activity or cell viability; and (3) is reversible by Congo red and trehalose. Since SiO 2 nanoparticles trigger a subnuclear pathology resembling the one occurring in expanded polyglutamine neurodegenerative disorders, we suggest that integrity of the functional architecture of the cell nucleus should be used as a read out for cytotoxicity and considered in the development of safe nanotechnology

  14. Uniform fabrication of Ge nanocrystals embedded into SiO2 film via neutron transmutation doping

    Directory of Open Access Journals (Sweden)

    Wei Liu

    2014-06-01

    Full Text Available Nanocrystalline 74Ge embedded SiO2 films were prepared by employing ion implantation and neutron transmutation doping methods. Transmission electron microscopy, energy dispersive x-ray spectroscopy, and photoluminescence of the obtained samples were measured. The existence of As dopants transmuted from 74Ge is significant to guarantee the uniformity and higher volume density of Ge nanocrystals by tuning the system׳s crystallinity and activating mass transfer process. It was observed that the photoluminescence intensity of Ge nanocrystals increased first then decreased with the increase of arsenic concentration. The optimized fluence of neutron transmutation doping was found to be 5.5×1017 cm−2 to achieve maximum photoluminescence emission in Ge embedded SiO2 film. This work opens a route in the three-dimensional nanofabrication of uniform Ge nanocrystals.

  15. Optical properties of amorphous SiO2-TiO2 multi-nanolayered coatings for 1064-nm mirror technology

    Science.gov (United States)

    Magnozzi, M.; Terreni, S.; Anghinolfi, L.; Uttiya, S.; Carnasciali, M. M.; Gemme, G.; Neri, M.; Principe, M.; Pinto, I.; Kuo, L.-C.; Chao, S.; Canepa, M.

    2018-01-01

    respect to the thin film reference. The results are discussed in the light of the existing literature on nanofilms of amorphous oxides.

  16. Polyetherimide-grafted Fe3O4@SiO2 nanoparticles as theranostic agents for simultaneous VEGF siRNA delivery and magnetic resonance cell imaging

    Directory of Open Access Journals (Sweden)

    Li T

    2015-07-01

    Full Text Available Tingting Li,1 Xue Shen,1 Yin Chen,1 Chengchen Zhang,1 Jie Yan,1 Hong Yang,1 Chunhui Wu,1,2 Hongjun Zeng,1,2 Yiyao Liu1,21Department of Biophysics, School of Life Science and Technology, 2Center for Information in Biomedicine, University of Electronic Science and Technology of China, Chengdu, Sichuan, People’s Republic of ChinaAbstract: Engineering a safe and high-efficiency delivery system for efficient RNA interference is critical for successful gene therapy. In this study, we designed a novel nanocarrier system of polyethyleneimine (PEI-modified Fe3O4@SiO2, which allows high efficient loading of VEGF small hairpin (shRNA to form Fe3O4@SiO2/PEI/VEGF shRNA nanocomposites for VEGF gene silencing as well as magnetic resonance (MR imaging. The size, morphology, particle stability, magnetic properties, and gene-binding capacity and protection were determined. Low cytotoxicity and hemolyticity against human red blood cells showed the excellent biocompatibility of the multifunctional nanocomposites, and also no significant coagulation was observed. The nanocomposites maintain their superparamagnetic property at room temperature and no appreciable change in magnetism, even after PEI modification. The qualitative and quantitative analysis of cellular internalization into MCF-7 human breast cancer cells by Prussian blue staining and inductively coupled plasma atomic emission spectroscopy analysis, respectively, demonstrated that the Fe3O4@SiO2/PEI/VEGF shRNA nanocomposites could be easily internalized by MCF-7 cells, and they exhibited significant inhibition of VEGF gene expression. Furthermore, the MR cellular images showed that the superparamagnetic iron oxide core of our Fe3O4@SiO2/PEI/VEGF shRNA nanocomposites could also act as a T2-weighted contrast agent for cancer MR imaging. Our data highlight multifunctional Fe3O4@SiO2/PEI/VEGF shRNA nanocomposites as a potential platform for simultaneous gene delivery and MR cell imaging, which are promising

  17. New Analytical Model for Short-Channel Fully Depleted Dual-Material-Gate Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

    Science.gov (United States)

    Te-Kuang Chiang,

    2010-07-01

    Using the exact solution of the two-dimensional Poisson equation, a new analytical model comprising two-dimensional potential and threshold voltage for short-channel fully depleted dual-material-gate silicon-on-insulator (SOI) metal-oxide-semiconductor field-effect transistors (MOSFETs) is developed. The model shows that the minimum acceptable channel length can be sustained while repressing the short-channel effects if a thin gate oxide and a thin silicon body are employed in the device. Moreover, by increasing the ratio of the screen gate length to control gate length, the threshold voltage roll-off can be more effectively reduced. The model is verified by the close agreement of its results with those of a numerical simulation using the device simulator MEDICI. The model not only offers an insight into the device physics but is also an efficient model for circuit simulation.

  18. A novel growth mode of alkane films on a SiO2 surface

    DEFF Research Database (Denmark)

    Mo, H.; Taub, H.; Volkmann, U.G.

    2003-01-01

    Synchrotron X-ray specular scattering measurements confirm microscopically a structural model recently inferred by very-high-resolution ellipsometry of a solid dotriacontane (n-C32H66 or C32) film formed by adsorption from solution onto a SiO2 surface. Sequentially, one or two layers adsorb on th...... previously for shorter alkanes deposited from the vapor phase onto solid surfaces....

  19. Effect of SiO2 Overlayer on WO3 Sensitivity to Ammonia

    Directory of Open Access Journals (Sweden)

    Vibha Srivastava

    2010-06-01

    Full Text Available Ammonia gas sensing properties of tungsten trioxide thick film sensor was investigated. The doping of noble catalysts such as Pt, Pd, Au enhanced the gas sensitivity. Platinum doping was found to result in highest sensitivity. Remarkable sensitivity enhancement was realized by coating WO3 thick film sensors with SiO2 overlayer. Sol gel process derived silica overlayer increased ammonia gas sensitivity for doped as well as undoped sensor.

  20. Structural verification and optical characterization of SiO2–Au–Cu2O ...

    Indian Academy of Sciences (India)

    In this paper, SiO2–Au–Cu2O core/shell/shell nanoparticles were synthesized by reducing gold chloride on 3-amino-propyl-triethoxysilane molecules attached silica nanoparticle cores for several stages. Cu2O nanoparticles were synthesized readily with the size of 4–5 nm using a simple route of sol–gel method. Then, they ...

  1. Effect of SiO2 protective layer on the femtosecond laser-induced damage of HfO2/SiO2 multilayer high-reflective coatings

    International Nuclear Information System (INIS)

    Yuan Lei; Zhao Yuanan; Wang Congjuan; He Hongbo; Fan Zhengxiu; Shao Jianda

    2007-01-01

    Two kinds of HfO 2 /SiO 2 800 nm high-reflective (HR) coatings, with and without SiO 2 protective layer were deposited by electron beam evaporation. Laser-induced damage thresholds (LIDT) were measured for all samples with femtosecond laser pulses. The surface morphologies and the depth information of all samples were observed by Leica optical microscopy and WYKO surface profiler, respectively. It is found that SiO 2 protective layer had no positive effect on improving the LIDT of HR coating. A simple model including the conduction band electron production via multiphoton ionization and impact ionization is used to explain this phenomenon. Theoretical calculations show that the damage occurs first in the SiO 2 protective layer for HfO 2 /SiO 2 HR coating with SiO 2 protective layer. The relation of LIDT for two kinds of HfO 2 /SiO 2 HR coatings in calculation agrees with the experiment result

  2. Hybrid top-gate transistors based on ink-jet printed zinc tin oxide and different organic dielectrics

    Science.gov (United States)

    Sykora, Benedikt; von Seggern, Heinz

    2018-01-01

    We report about hybrid top-gate transistors based on ink-jet printed zinc tin oxide (ZTO) and different spin-coated organic dielectrics. Transistors using the polar dielectric poly(methyl methacrylate) (PMMA) and the nonpolar polystyrene (PS) were evaluated. By applying PMMA, we were able to process field-effect transistors with a saturation mobility of up to 4.3 cm2 V-1 s-1. This is the highest reported mobility of an ink-jet printed ZTO top-gate transistor using a spin-coated PMMA dielectric. This transistor also exhibits a small threshold voltage of 1.7 V and an on/off-current ratio exceeding 105. The usage of PS as another organic dielectric leads to functional devices with inferior performance, meaning a saturation mobility of 0.2 cm2 V-1 s-1 and a threshold voltage of 9.7 V. The more polar character of the PMMA compared to the PS dielectric leading to a better adhesion on the quite hydrophilic ZTO surface could explain the improved device performance of the ZTO top-gate transistor using PMMA.

  3. Synthesis of Y2O3-ZrO2-SiO2 composite coatings on carbon fiber reinforced resin matrix composite by an electro-plasma process

    Science.gov (United States)

    Zhang, Yuping; Lin, Xiang; Chen, Weiwei; Cheng, Huanwu; Wang, Lu

    2016-05-01

    In the present paper the Y2O3-ZrO2-SiO2 composite coating was successfully synthesized on carbon fiber reinforced resin matrix composite by an electro-plasma process. The deposition process, microstructures and oxidation resistance of the coatings with different SiO2 concentrations were systematically investigated. A relatively dense microstructure was observed for the Y2O3-ZrO2-SiO2 composite coating with the SiO2 concentration above 5 g/L. The coating exhibited very good oxidation resistance at 1273 K with the mass loss rate as low as ∼30 wt.%, compared to 100 wt.% of the substrate. The formation of the ceramic composites was discussed in detail based on the electrochemical mechanism and the deposition dynamics in order to explain the effect of the plasma discharge. We believe that the electro-plasma process will find wide applications in preparing ceramics and coatings in industries.

  4. Single-electron effects in non-overlapped multiple-gate silicon-on-insulator metal-oxide-semiconductor field-effect transistors.

    Science.gov (United States)

    Lee, W; Su, P

    2009-02-11

    This paper systematically presents controlled single-electron effects in multiple-gate silicon-on-insulator (SOI) metal-oxide-semiconductor field-effect transistors (MOSFETs) with various gate lengths, fin widths, gate bias and temperature. Our study indicates that using the non-overlapped gate to source/drain structure as an approach to the single-electron transistor (SET) in MOSFETs is promising. Combining the advantage of gate control and the constriction of high source/drain resistances, single-electron effects are further enhanced using the multiple-gate architecture. From the presented results, downsizing multiple-gate SOI MOSFETs is needed for future room-temperature SET applications. Besides, the tunnel barriers and access resistances may need to be further optimized. Since the Coulomb blockade oscillation can be achieved in state-of-the-art complementary metal-oxide-semiconductor (CMOS) devices, it is beneficial to build SETs in low-power CMOS circuits for ultra-high-density purposes.

  5. Direct fabrication of graphene on SiO2 enabled by thin film stress engineering

    Science.gov (United States)

    McNerny, Daniel Q.; Viswanath, B.; Copic, Davor; Laye, Fabrice R.; Prohoda, Christophor; Brieland-Shoultz, Anna C.; Polsen, Erik S.; Dee, Nicholas T.; Veerasamy, Vijayen S.; Hart, A. John

    2014-01-01

    We demonstrate direct production of graphene on SiO2 by CVD growth of graphene at the interface between a Ni film and the SiO2 substrate, followed by dry mechanical delamination of the Ni using adhesive tape. This result is enabled by understanding of the competition between stress evolution and microstructure development upon annealing of the Ni prior to the graphene growth step. When the Ni film remains adherent after graphene growth, the balance between residual stress and adhesion governs the ability to mechanically remove the Ni after the CVD process. In this study the graphene on SiO2 comprises micron-scale domains, ranging from monolayer to multilayer. The graphene has >90% coverage across centimeter-scale dimensions, limited by the size of our CVD chamber. Further engineering of the Ni film microstructure and stress state could enable manufacturing of highly uniform interfacial graphene followed by clean mechanical delamination over practically indefinite dimensions. Moreover, our findings suggest that preferential adhesion can enable production of 2-D materials directly on application-relevant substrates. This is attractive compared to transfer methods, which can cause mechanical damage and leave residues behind. PMID:24854632

  6. Stabilization of SiO2 nanoparticle foam system and evaluation of its performance

    Science.gov (United States)

    Sun, Chong; Fan, Zhenzhong; Liu, Qingwang; Wang, Jigang; Xu, Jianjun

    2017-05-01

    As tertiary recovery is applied in the oil field, foam flooding technology plays an important role in the oil field. Steam flooding is easy to generate a series of problems such as excessive pressure, gas channelling, heat loss ect. The foam flooding can be better used in the formation of plugging and profile control. However, the foam is not stabilizing in thermodynamics and breaks easily while it encounters oil. So the emphasis of the research is how to make the foam stable. The Warning Blender method is used to evaluate the foam In the course of experiment, which verifies that the modified Nano SiO2 solid not only works very well in coordination with SDS solution but also contributes to the generation of stable foam in solution. The optimum concentration of SDS is determined by 0.5%, and the best concentration is 1.4% of H20 type SiO2 particles that the concentration is 79.26°. Finally, the 0.5%SDS+1.4%H2O type SiO2 is chosen as the complete foam flooding system, and the performance of salt tolerance and oil displacement of composite foam system is evaluated. It is concluded that the stability of foam is the key to improve the oil recovery.

  7. Reduction of SiO2 to SiC Using Natural Gas

    Science.gov (United States)

    Ksiazek, Michal; Tangstad, Merete; Dalaker, Halvor; Ringdalen, Eli

    2014-09-01

    This paper presents a preliminary study of SiC production by use of natural gas for reduction of silica. Direct reduction of SiO2 by gas mixtures containing CH4, H2, and Ar was studied at temperatures between 1273 K and 1773 K (1000 °C and 1500 °C). Silica in form of particles between 1 and 3 mm and pellets with mean grain size 50 µm were exposed to the gas mixture for 6 hours. Influence of temperature and CH4H2 ratio was investigated. Higher temperature and CH4 concentration resulted in greater SiC production. Two kinds of SiC were found: one was deposited between SiO2 particles, the other one was deposited inside the SiO2 particles. Although the exact reaction mechanisms have not been determined, it is clear that gas-phase reactions play an important role in both cases. The reaction products were analyzed by Electron Probe Micro Analyzer.

  8. Strong piezoelectricity in single-layer graphene deposited on SiO2 grating substrates.

    Science.gov (United States)

    da Cunha Rodrigues, Gonçalo; Zelenovskiy, Pavel; Romanyuk, Konstantin; Luchkin, Sergey; Kopelevich, Yakov; Kholkin, Andrei

    2015-06-25

    Electromechanical response of materials is a key property for various applications ranging from actuators to sophisticated nanoelectromechanical systems. Here electromechanical properties of the single-layer graphene transferred onto SiO2 calibration grating substrates is studied via piezoresponse force microscopy and confocal Raman spectroscopy. The correlation of mechanical strains in graphene layer with the substrate morphology is established via Raman mapping. Apparent vertical piezoresponse from the single-layer graphene supported by underlying SiO2 structure is observed by piezoresponse force microscopy. The calculated vertical piezocoefficient is about 1.4 nm V(-1), that is, much higher than that of the conventional piezoelectric materials such as lead zirconate titanate and comparable to that of relaxor single crystals. The observed piezoresponse and achieved strain in graphene are associated with the chemical interaction of graphene's carbon atoms with the oxygen from underlying SiO2. The results provide a basis for future applications of graphene layers for sensing, actuating and energy harvesting.

  9. A highly efficient g-C3N4/SiO2heterojunction: the role of SiO2in the enhancement of visible light photocatalytic activity.

    Science.gov (United States)

    Hao, Qiang; Niu, Xiuxiu; Nie, Changshun; Hao, Simeng; Zou, Wei; Ge, Jiangman; Chen, Daimei; Yao, Wenqing

    2016-11-23

    SiO 2 , an insulator, hardly has any photocatalytic acitivity due to its intrinsic property, and it is generally used as a hard template to increase the surface area of catalysts. However, in this work, we found that the surface state of the insulator SiO 2 can promote the migration of photogenerated charge carriers, leading to the enhancement of the photooxidation ability of graphitic carbon nitride (g-C 3 N 4 ). A one-pot calcination method was employed to prepare g-C 3 N 4 /SiO 2 composites using melamine and SiO 2 as precursors. The composites present considerably high photocatalytic degradation activities for 2,4-dichlorophenol (2,4-DCP) and rhodamine B (RhB) under visible light (λ > 420 nm) irradiation, which are about 1.53 and 4.18 times as high as those of bulk g-C 3 N 4 , respectively. The enhancement of the photocatalytic activity is due to the fact that the introduction of the insulator SiO 2 in g-C 3 N 4 /SiO 2 composites can greatly improve the specific surface area of the composites; more importantly, the impurity energy level of SiO 2 can help accelerate the separation and transfer of electron-hole pairs of g-C 3 N 4 . Electron paramagnetic resonance (EPR) spectroscopy and trapping experiments with different radical scavengers show that the main active species of g-C 3 N 4 are superoxide radicals, while holes also play a role in photodegradation. For g-C 3 N 4 /SiO 2 -5, besides superoxide radicals and holes, the effect of hydroxyl radicals was greatly improved. Finally, a possible mechanism for the photogenerated charge carrier migration of the g-C 3 N 4 /SiO 2 photocatalyst was proposed.

  10. Photocatalytic application of TiO2/SiO2-based magnetic nanocomposite (Fe3O4@SiO2/TiO2) for reusing of textile wastewater

    OpenAIRE

    Laleh Enayati Ahangar; Karim Movassaghi; Masoomeh Emadi; Fatemeh Yaghoobi

    2016-01-01

    In this research we have developed a treatment method for textile wastewater by TiO2/SiO2-based magnetic nanocomposite. Textile wastewater includes a large variety of dyes and chemicals and needs treatments. This manuscript presents a facile method for removing dyes from the textile wastewater by using TiO2/SiO2-based nanocomposite (Fe3O4@SiO2/TiO2) under UV irradiation. This magnetic nanocomposite, as photocatalytically active composite, is synthesized via solution method in mild conditions....

  11. Low-voltage organic field-effect transistors (OFETs) with solution-processed metal-oxide as gate dielectric.

    Science.gov (United States)

    Su, Yaorong; Wang, Chengliang; Xie, Weiguang; Xie, Fangyan; Chen, Jian; Zhao, Ni; Xu, Jianbin

    2011-12-01

    In this study, low-voltage copper phthalocyanine (CuPc)-based organic field-effect transistors (OFETs) are demonstrated utilizing solution-processed bilayer high-k metal-oxide (Al(2)O(y)/TiO(x)) as gate dielectric. The high-k metal-oxide bilayer is fabricated at low temperatures (OFETs show high electric performance with high hole mobility of 0.06 cm(2)/(V s), threshold voltage of -0.5 V, on/off ration of 2 × 10(3) and a very small subthreshold slope of 160 mV/dec when operated at -1.5 V. Our study demonstrates a simple and robust approach that could be used to achieve low-voltage operation with solution-processed technique. © 2011 American Chemical Society

  12. The Role of SiO2 Gas in the Operation of Anti-Corrosion Coating Produced by PVD

    Directory of Open Access Journals (Sweden)

    Meysam Zarchi

    2015-09-01

    Full Text Available This study examined theSiO2 gas present in the coatings used in corrosion industry.These layers have been created by physical vapor deposition (PVD, with an appropriate performance. Sublimation of SiO2is used to protect PVD aluminum flakes from water corrosionand to generate highly porous SiO2 flakes with holes in the nanometer range. SiOx/Al/SiOx sandwiches were made as well as Ag loaded porous SiO2 as antimicrobial filler.

  13. Role of the interface region on the optoelectronic properties of silicon nanocrystals embedded in SiO2

    International Nuclear Information System (INIS)

    Daldosso, N.; Dalba, G.; Fornasini, P.; Grisenti, R.; Pavesi, L.; Luppi, M.; Magri, R.; Ossicini, S.; Degoli, E.; Rocca, F.; Boninelli, S.; Priolo, F.; Spinella, C.; Iacona, F.

    2003-01-01

    Light-emitting silicon nanocrystals embedded in SiO 2 have been investigated by x-ray absorption measurements in total electron and photoluminescence yields, by energy filtered transmission electron microscopy and by ab initio total energy calculations. Both experimental and theoretical results show that the interface between the silicon nanocrystals and the surrounding SiO 2 is not sharp: an intermediate region of amorphous nature and variable composition links the crystalline Si with the amorphous stoichiometric SiO 2 . This region plays an active role in the light-emission process

  14. Influence of SiO2/Al2O3 Molar Ratio on Phase Composition and Surfaces Quality of Aluminum Silicate Sanitary Glazes in the SiO2-Al2O3-CaO-Na2O System

    Directory of Open Access Journals (Sweden)

    Leśniak M.

    2016-12-01

    Full Text Available This paper presents the results of research on aluminum silicate sanitary glazes in the SiO2-Al2O3-CaO-Na2O system with different SiO2/Al2O3 molar ratio. XRD, SEM-EDS and FITR measurement indicated that SiO2/Al2O3 molar ratio has a significant impact on the phase composition of the obtained glazes. Glass-ceramic glazes were obtained that consisted of both the glass phase and pseudowollastonite (Ca3[SiO3]3 or anorthite (Ca[Al2Si2O8] crystals. Subsequently, the influence of phase composition on surface quality (roughness was examined for the obtained samples. On the basis of the conducted examination of glaze surface roughness was observed that glazes of extreme SiO2/Al2O3 molar ratio are characterized with greatest surface roughness when compared to other glazes.

  15. Photocatalytic Removal of Phenol under Natural Sunlight over N-TiO2-SiO2 Catalyst: The Effect of Nitrogen Composition in TiO2-SiO2

    Directory of Open Access Journals (Sweden)

    Viet-Cuong Nguyen

    2009-01-01

    Full Text Available In this present work, high specific surface area and strong visible light absorption nitrogen doped TiO2-SiO2 photocatalyst was synthesized by using sol-gel coupled with hydrothermal treatment method. Nitrogen was found to improve the specific surface area while it also distorted the crystal phase of the resulting N-TiO2-SiO2 catalyst. As the N/ (TiO2-SiO2 molar ratio was more than 10%, the derived catalyst presented the superior specific surface area up to 260 m2/g. Nevertheless, its photoactivity towards phenol removal was observed to significantly decrease, which could results from the too low crystallinity. The nitrogen content in N-TiO2-SiO2 catalyst was therefore necessary to be optimized in terms of phenol removal efficiency and found at ca. 5%. Under UVA light and natural sunlight irradiation of 80 min, N(5%-TiO2-SiO2 catalyst presented the phenol decomposition efficiencies of 68 and 100%, respectively. It was also interestingly found in this study that the reaction rate was successfully expressed using a Langmuir-Hinshelwood (L-H model, indicating the L-H nature of photocatalytic phenol decomposition reaction on the N-TiO2-SiO2 catalyst.

  16. Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer

    Directory of Open Access Journals (Sweden)

    Yu-Hua Liu

    2017-11-01

    Full Text Available Gold-nanoparticle (Au-NP non-volatile memories (NVMs with low-damage CF4 plasma treatment on the blocking oxide (BO layer have been investigated to present the gate injection of the holes. These holes, injected from the Al gate with the positive gate bias, were explained by the bandgap engineering of the gradually-fluorinated BO layer and the effective work function modulation of the Al gate. The Si–F complex in the BO layer was analyzed by X-ray photoelectron spectroscopy (XPS, while the depth of fluorine incorporation was verified using a secondary ion mass spectrometer (SIMS. In addition, the valence band modification of the fluorinated BO layer was examined by ultraviolet photoelectron spectroscopy (UPS to support the bandgap engineering. The reactive power of the CF4 plasma treatment on the BO layer was modified to increase the electric field of the BO layer and raise the effective work function of the Al gate, leading to the hole-injection from the gate. The injected holes are trapped at the interface between the gold-nanoparticles (Au-NPs and the tunneling oxide (TO layer, resulting in superior data retention properties such as an extremely low charge loss of 5.7% at 104 s and a nearly negligible increase in charge loss at 85 °C of the CF4-plasma-treated Au-NP NVMs, which can be applied in highly reliable consumer electronics.

  17. Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF₄-Plasma-Treated Blocking Oxide Layer.

    Science.gov (United States)

    Liu, Yu-Hua; Kao, Chyuan-Haur; Cheng, Tsung-Chin; Wu, Chih-I; Wang, Jer-Chyi

    2017-11-10

    Gold-nanoparticle (Au-NP) non-volatile memories (NVMs) with low-damage CF₄ plasma treatment on the blocking oxide (BO) layer have been investigated to present the gate injection of the holes. These holes, injected from the Al gate with the positive gate bias, were explained by the bandgap engineering of the gradually-fluorinated BO layer and the effective work function modulation of the Al gate. The Si-F complex in the BO layer was analyzed by X-ray photoelectron spectroscopy (XPS), while the depth of fluorine incorporation was verified using a secondary ion mass spectrometer (SIMS). In addition, the valence band modification of the fluorinated BO layer was examined by ultraviolet photoelectron spectroscopy (UPS) to support the bandgap engineering. The reactive power of the CF₄ plasma treatment on the BO layer was modified to increase the electric field of the BO layer and raise the effective work function of the Al gate, leading to the hole-injection from the gate. The injected holes are trapped at the interface between the gold-nanoparticles (Au-NPs) and the tunneling oxide (TO) layer, resulting in superior data retention properties such as an extremely low charge loss of 5.7% at 10⁴ s and a nearly negligible increase in charge loss at 85 °C of the CF₄-plasma-treated Au-NP NVMs, which can be applied in highly reliable consumer electronics.

  18. Strain-gated piezotronic transistors based on vertical zinc oxide nanowires.

    Science.gov (United States)

    Han, Weihua; Zhou, Yusheng; Zhang, Yan; Chen, Cheng-Ying; Lin, Long; Wang, Xue; Wang, Sihong; Wang, Zhong Lin

    2012-05-22

    Strain-gated piezotronic transistors have been fabricated using vertically aligned ZnO nanowires (NWs), which were grown on GaN/sapphire substrates using a vapor-liquid-solid process. The gate electrode of the transistor is replaced by the internal crystal potential generated by strain, and the control over the transported current is at the interface between the nanowire and the top or bottom electrode. The current-voltage characteristics of the devices were studied using conductive atomic force microscopy, and the results show that the current flowing through the ZnO NWs can be tuned/gated by the mechanical force applied to the NWs. This phenomenon was attributed to the piezoelectric tuning of the Schottky barrier at the Au-ZnO junction, known as the piezotronic effect. Our study demonstrates the possibility of using Au droplet capped ZnO NWs as a transistor array for mapping local strain. More importantly, our design gives the possibility of fabricating an array of transistors using individual vertical nanowires that can be controlled independently by applying mechanical force/pressure over the top. Such a structure is likely to have important applications in high-resolution mapping of strain/force/pressure.

  19. Investigation of MOS Interfaces with Atomic-Layer-Deposited High-k Gate Dielectrics on III-V Semiconductors

    Science.gov (United States)

    Suri, Rahul

    The purpose of this research work was to investigate the surface passivation methods and metal gate/high-k dielectric gate stacks for metal-oxide-semiconductor devices (MOS) on III-V compound semiconductor materials -- (i) GaAs for future high-speed low-power logic devices and (ii) AlGaN/GaN heterostructure for future high-speed high-power devices. GaAs is a candidate material for high-mobility channel in a NMOS transistor to extend the CMOS scaling up to and beyond the 16-nm technology node. AlGaN/GaN heterostructure is useful in a MOS-high electron mobility transistor (MOS-HEMT) device for providing a high current-carrying two dimensional electron gas (2DEG) channel. The interaction of GaAs surface with atomic layer deposition of high- k dielectrics was investigated to gain fundamental insights into the chemical properties of GaAs surface oxides and high-k/GaAs interface. Electrical characterization of devices was performed to understand the impact of high-k/GaAs interface on MOS device characteristics in order to form a suitable metal/high-k/GaAs gatestack for future high-speed logic and power devices. Reduction of native oxides on GaAs was found to occur during atomic layer deposition (ALD) of high-k dielectrics- HfO2 and Al2O3/HfO 2 nanolaminates on GaAs. Reaction between ALD metal precursor and native oxides on GaAs was identified to be the cause for consumption of native oxides. It was established that the ALD growth temperature has a strong impact on this phenomenon. During post-dielectric annealing the residual arsenic oxides at the interface decomposed leading to an increase in the interfacial gallium oxides. Presence of gallium oxide, Ga2O3 was identified as a cause for observed frequency dispersion in MOS capacitance-voltage curves indicative of a high interface state density. The chemical properties of the AlGaN/GaN heterostructure surface prepared by wet chemical treatment using HCl/HF and NH4OH solutions were investigated and compared. Both HCl and

  20. Experimental research of stability of emulsion systems with SIO2 nanoparticles.

    Directory of Open Access Journals (Sweden)

    Zeigman Yury Veniaminovich

    2017-10-01

    Full Text Available Since the beginning of the 21st century scientific research devoted to properties of nanosized particles and their industrial application in the industry of oil and gas fields development has been rapidly evolving. The use of nanosized particles can significantly rise efficiency of technological solutions, and that fact determines this research area as the most promising today. In the area of oil and gas fields development one of the general application for nanoparticles is the development of high-performance technological fluids with new or improved physico-chemical properties. The ability of nanoparticles to modify wettability of the rock surface and to be fixed on the adsorption-solvation stratums of globules makes them a unique tool to regulate physicochemical properties of technological fluids and physical properties of rocks.The article reveals the results of a new stage in the research of physical properties of emulsion systems with silicon dioxide nanoparticles (SiO2. The research carried out within the framework of international project «Development and implementation of water-blocking agents based on the SiO2 nanoparticles application». The results of comparative tests of stability of classical emulsions (O/W and W/O types and emulsion systems modified with SiO2 nanoparticles with different wettability characteristics (hydrophilic or hydrophobic are presented. According to the results of comparative tests, it has been determined that the stability of most samples of modified emulsion systems containing hydrophilic or hydrophobic silica nanoparticles exceeds the stability of classical emulsions by more than 100%. In the course of comparative studies, the following types of experiments were performed: measurement of aggregate stability, electrostability and thermal stability of samples. The paper is a continuation of the complex research which has been published in [1].

  1. Thermal conductivity and electrical properties of hybrid SiO2-graphene naphthenic mineral oil nanofluid as potential transformer oil

    Science.gov (United States)

    Qing, Soo Hui; Rashmi, W.; Khalid, M.; Gupta, T. C. S. M.; Nabipoor, M.; Taghi Hajibeigy, Mohammad

    2017-01-01

    Hybrid SiO2-graphene nanoparticles were synthesised by sol gel centrifugation technique under four different pH levels ranging from 9 to 12. Stability, thermal conductivity, viscosity and electrical conductivity of hybrid SiO2-graphene and pure graphene dispersed in naphthenic oil were investigated. Nanofluids were synthesied at three different nanoparticle concentrations (0.01, 0.04 and 0.08 wt%) while the temperature was varied from 20 °C to 100 °C. Field emission scanning electron microscopy (FESEM), x-ray spectroscopy and Fourier transform infrared (FTIR) spectrometer show successful coating of SiO2 on graphene surface. The growth units and size distribution of SiO2 nanoparticles increased with pH level. Moreover, the presence of SiO2 improved the dispersion behaviour of the nanofluid as confirmed by visual observation and UV-Vis studies. Zeta potential measurements show the hybrid nanofluids at pH 11 are most stable due to its optimum amount and size of SiO2 coated on graphene surface while at pH 12 shows least stability due to precipitation. The presence of SiO2 on graphene further enhanced the thermal conductivity by 80% at pH 9. Also, the viscosity of hybrid nanofluids was higher than pure graphene based nanofluids due to increase in density and particle size. Moreover, the addition of hybrid SiO2-graphene nanoparticles significantly reduced the electrical conductivity enhancement of base fluid from 557% to 97%.

  2. CMOS Compatible Nonvolatile Memory Devices Based on SiO2/Cu/SiO2 Multilayer Films

    Science.gov (United States)

    Wang, Yan; Liu, Qi; Lu, Hang-Bing; Long, Shi-Bing; Zhang, Sen; Li, Ying-Tao; Lian, Wen-Tai; Yang, Jian-Hong; Liu, Ming

    2011-07-01

    We systematically investigate the resistive switching characteristics of SiO2 films with a Cu/SiO2/Cu/SiO2/Pt multilayer structure. The device exhibits good resistive switching performances, including a high ON/OFF resistance ratio (>103), good retention characteristic (>104s), satisfactory switching endurance (>200 cycles), a fast programming speed (<100 ns) and a high device yield (~100%). Considering these results, SiO2-based memories have highly promising applications for nonvolatile memory devices.

  3. On the reduction of direct tunneling leakage through ultrathin gate oxides by a one-dimensional Schrödinger-Poisson solver

    Science.gov (United States)

    Cassan, Eric

    2000-06-01

    A full self-consistent one-dimensional Schrödinger-Poisson model is reported in this article, which is specifically dedicated to the study of direct tunneling current through ultrathin gate oxide of metal-oxide-semiconductor (MOS) structures. The gate current is obtained by estimating the quasibound state lifetimes within the formalism of the formal reflection delay time of wave packets using the transfer-matrix method. As an alternative design to conventional MOS structures, two strategies are investigated in this work to scale oxide thickness in the sub 1.5 nm range while keeping an acceptable gate current leakage of some A/cm2. These include nitride/oxide stacked gate dielectrics used to increase the insulator thickness, and heterostructure MOS capacitors to confine electrons in a buried quantum well. Tensile strained Si1-yCy/Si and Si/Si1-xGex heterostructures that provide a convenient conduction band offset are proposed in this order. A conduction band offset of 0.19 eV is shown to yield nearly the same but limited improvement than the stacked gate dielectrics structure. Compared with the conventional MOS device of equivalent oxide thickness, a gate current reduction by more than two orders of magnitude is reached by using a heterostructure with a conduction band offset of 0.31 eV. For MOS transistor application this significant gain may be in addition to the driving current increase that can be expected from the strain-induced improvement of electron transport properties.

  4. Bonding and XPS chemical shifts in ZrSiO4 versus SiO2 and ZrO2: Charge transfer and electrostatic effects

    International Nuclear Information System (INIS)

    Guittet, M.J.; Gautier-Soyer, M.; Crocombette, J.P.

    2001-01-01

    The degree of ionic/covalent character in oxides has a great influence on the electronic structure and the material's properties. A simple phenomenological rule is currently used to predict the evolution of covalence/ionicity in mixed oxides compared to the parent ones, and is also widely used to interpret the x-ray photoelectron spectroscopy (XPS) binding-energy shifts of the cations in terms of charge transfer. We test the validity of this simple rule and its application to XPS of mixed oxides with a prototypical system: zircon ZrSiO 4 and parent oxides ZrO 2 and SiO 2 . The ionic charges on Si, Zr, and O were extracted from the density functional theory in the local density approximation calculations in the plane-wave formalism. In agreement with the predictions of the phenomenological rule, the most ionic cation (Zr) becomes more ionic in ZrSiO 4 than in ZrO 2 , while the more covalent one (Si) experiences a corresponding increase in covalence with respect to SiO 2 . The XPS chemical shifts of the O 1s, Si 2p, and Zr 3d 5/2 photoelectron lines in the three oxides were measured and the respective contributions of charge transfer and electrostatic effects (initial state), as well as extra-atomic relaxation effects (final state) evaluated. The validity of the phenomenological rule of mixed oxides used in x-ray electron spectroscopy as well as the opportunity to use the O1s binding-energy shifts to derive a scale of covalence in silicates is discussed

  5. Friction and wear properties of ZrO2/SiO2 composite nanoparticles

    International Nuclear Information System (INIS)

    Li Wei; Zheng Shaohua; Cao Bingqiang; Ma Shiyu

    2011-01-01

    In this article, the lubrication properties of ZrO 2 /SiO 2 composite nanoparticles modified with aluminum zirconium coupling agent as additives in lubricating oil under variable applied load and concentration fraction were reported. It was demonstrated that the modified nanoparticles as additives in lubrication can effectively improve the lubricating properties. Under an optimized concentration of 0.1 wt%, the average friction coefficient was reduced by 16.24%. This was because the nanoparticles go into the friction zone with the flow of lubricant, and then the sliding friction changed to rolling friction with a result of the reduction of the friction coefficient.

  6. Enhanced photoluminescence by resonant absorption in Er-doped SiO2/Si microcavities

    Science.gov (United States)

    Schubert, E. F.; Hunt, N. E. J.; Vredenberg, A. M.; Harris, T. D.; Poate, J. M.; Jacobson, D. C.; Wong, Y. H.; Zydzik, G. J.

    1993-11-01

    Si/SiO2 Fabry-Perot microcavities with an Er-implanted SiO2 active region resonant at the Er excitation wavelength of 980 nm have been realized. Room-temperature photoluminescence measurements reveal that the Er luminescence intensity increases by a factor of 28 as compared to a structure without cavity enhancement. We show that the experimental enhancement of the luminescence intensity agrees with theory if optical absorption of the 980 nm light in the Si layers of the cavity and reduced mirror reflectivities are taken into account.

  7. Scanning electron microscopy study of protein immobilized on SIO2 Sol-gel surfaces

    Directory of Open Access Journals (Sweden)

    Assis O.B.G.

    2003-01-01

    Full Text Available Uniform attachment of enzymes to solid surfaces is essential in the development of bio and optical sensor devices. Immobilization by adsorption according to hydrophilic or hydrophobic nature is dependent on the charges and defects of the support surfaces. Sol-gel SiO2 densified glass surfaces, frequently used as supports for protein immobilization, are evaluated via scanning electron microscopy. The model protein is globular enzyme lysozyme, deposited by adsorption on functionalized surfaces. Formation of a protein layer is confirmed by FTIR spectroscopy, and the SEM images suggest discontinuous adsorption in areas where cracks predominate on the glass surface.

  8. Diffraction of slow neutrons by holographic SiO2 nanoparticle-polymer composite gratings

    Science.gov (United States)

    Klepp, J.; Pruner, C.; Tomita, Y.; Plonka-Spehr, C.; Geltenbort, P.; Ivanov, S.; Manzin, G.; Andersen, K. H.; Kohlbrecher, J.; Ellabban, M. A.; Fally, M.

    2011-07-01

    Diffraction experiments with holographic gratings recorded in SiO2 nanoparticle-polymer composites have been carried out with slow neutrons. The influence of parameters such as nanoparticle concentration, grating thickness, and grating spacing on the neutron-optical properties of such materials has been tested. Decay of the grating structure along the sample depth due to disturbance of the recording process becomes an issue at grating thicknesses of about 100 microns and larger. This limits the achievable diffraction efficiency for neutrons. As a solution to this problem, the Pendellösung interference effect in holographic gratings has been exploited to reach a diffraction efficiency of 83% for very cold neutrons.

  9. Disordered electrical potential observed on the surface of SiO2 by electric field microscopy

    International Nuclear Information System (INIS)

    GarcIa, N; Yan Zang; Ballestar, A; Barzola-Quiquia, J; Bern, F; Esquinazi, P

    2010-01-01

    The electrical potential on the surface of ∼300 nm thick SiO 2 grown on single-crystalline Si substrates has been characterized at ambient conditions using electric field microscopy. Our results show an inhomogeneous potential distribution with fluctuations up to ∼0.4 V within regions of 1 μm. The potential fluctuations observed at the surface of these usual dielectric holders of graphene sheets should induce strong variations in the graphene charge densities and provide a simple explanation for some of the anomalous behaviors of the transport properties of graphene.

  10. SiO2-supported Pt particles studied by electron microscopy

    International Nuclear Information System (INIS)

    Wang, D.; Penner, S.; Su, D.S.; Rupprechter, G.; Hayek, K.; Schloegl, R.

    2003-01-01

    Regularly grown Pt particles supported by amorphous SiO 2 were heated in hydrogen at 873 K after an oxidising treatment. The morphological and structural changes were studied by electron microscopy. Platinum silicides Pt 3 Si with L1 2 (Cu 3 Au) structure, monoclinic Pt 3 Si and tetragonal Pt 12 Si 5 were identified after the treatment. The mechanisms of coalescence of the particles and the formation of irregular large particles are suggested. A topotactic structural transformation accompanied with the migration of Si from the substrate to the particles are suggested to take place during Pt 3 Si formation

  11. Experimental study of viscosity properties of emulsion system with SiO2 nanoparticles.

    Directory of Open Access Journals (Sweden)

    ZEIGMAN Yury Veniaminovich,

    2017-04-01

    Full Text Available When oil production is increasing due to intensive oilfield development methods supporting seam pressure by water injection oil producers face the problem of displacement agent break in more permeable intervals of petroleum reservoir. That leads to dramatic increase of product inundation for well stock and decrease of economic efficiency for well performance. Nowadays the petroleum engineers have proposed more than 100 technologies designed to restrict water inflows and flooding agent to bottom-hole zone of the production wells. The water inflows restriction technologies are distinguished by the type of applied chemical compositions and the way how the chemical compositions are delivered to bottom-hole zone. The analysis of the currently applied chemical compositions has allowed authors to reveal the common feature. The common feature is that the currently applied chemical compositions are non-selective and they produce isolating or blocking effect onto water-saturated and oil-saturated zones of the petroleum reservoir. The application of the nonselective high-stability chemical compositions leads to uncontrolled colmatation of all treated intervals and makes it difficult to involve them into filtration process in future. This work presents the technology for the selective reservoir stimulation based on emulsion systems with SiO2 nanoparticles content and gelling acid composition. The technology was developed for complex impact on formation system, that achieved by blocking water-saturated intervals of reservoir and stimulation of less permeable oil-saturated intervals of reservoir. The paper shows the results of complex laboratory experiments to study viscosity parameters of emulsion systems with SiO2 nanoparticles content. The results of the experiments revealed the ability of the SiO2 nanoparticles to rise dynamic viscosity of the different type of emulsion systems: oil in water and water in oil. Test for thermostability of the modified emulsion systems showed stability of the systems under 80о C. In addition, the modified emulsion systems kept the ability to decrease significantly viscosity in the reaction with hydrocarbons, i.e. the emulsion systems with SiO2 nanoparticles are selective compositions for the water-inflows restriction.

  12. Ordering at Si(111)/o-Si and Si(111)/SiO2 Interfaces

    DEFF Research Database (Denmark)

    Robinson, I. K.; Waskiewicz, W. K.; Tung, R. T.

    1986-01-01

    X-ray diffraction has been used to measure the intensity profile of the two-dimensional rods of scattering from a single interface buried inside a bulk material. In both Si(111)/a-Si and Si(111)/SiO2 examples there are features in the perpendicular-momentum-transfer dependence which are not expec...... are not expected from an ideal sharp interface. The diffraction profiles are explained by models with partially ordered layers extending into the amorphous region. In the Si(111)/a-Si case there is clear evidence of stacking faults which are attributed to residual 7×7 reconstruction....

  13. New intelligent multifunctional SiO2/VO2 composite films with enhanced infrared light regulation performance, solar modulation capability, and superhydrophobicity.

    Science.gov (United States)

    Wang, Chao; Zhao, Li; Liang, Zihui; Dong, Binghai; Wan, Li; Wang, Shimin

    2017-01-01

    Highly transparent, energy-saving, and superhydrophobic nanostructured SiO 2 /VO 2 composite films have been fabricated using a sol-gel method. These composite films are composed of an underlying infrared (IR)-regulating VO 2 layer and a top protective layer that consists of SiO 2 nanoparticles. Experimental results showed that the composite structure could enhance the IR light regulation performance, solar modulation capability, and hydrophobicity of the pristine VO 2 layer. The transmittance of the composite films in visible region ( T lum ) was higher than 60%, which was sufficient to meet the requirements of glass lighting. Compared with pristine VO 2 films and tungsten-doped VO 2 film, the near IR control capability of the composite films was enhanced by 13.9% and 22.1%, respectively, whereas their solar modulation capability was enhanced by 10.9% and 22.9%, respectively. The water contact angles of the SiO 2 /VO 2 composite films were over 150°, indicating superhydrophobicity. The transparent superhydrophobic surface exhibited a high stability toward illumination as all the films retained their initial superhydrophobicity even after exposure to 365 nm light with an intensity of 160 mW . cm -2 for 10 h. In addition, the films possessed anti-oxidation and anti-acid properties. These characteristics are highly advantageous for intelligent windows or solar cell applications, given that they can provide surfaces with anti-fogging, rainproofing, and self-cleaning effects. Our technique offers a simple and low-cost solution to the development of stable and visible light transparent superhydrophobic surfaces for industrial applications.

  14. Nano-regime Length Scales Extracted from the First Sharp Diffraction Peak in Non-crystalline SiO2 and Related Materials: Device Applications

    Directory of Open Access Journals (Sweden)

    Phillips James

    2010-01-01

    Full Text Available Abstract This paper distinguishes between two different scales of medium range order, MRO, in non-crystalline SiO2: (1 the first is ~0.4 to 0.5 nm and is obtained from the position of the first sharp diffraction peak, FSDP, in the X-ray diffraction structure factor, S(Q, and (2 the second is ~1 nm and is calculated from the FSDP full-width-at-half-maximum FWHM. Many-electron calculations yield Si–O third- and O–O fourth-nearest-neighbor bonding distances in the same 0.4–0.5 nm MRO regime. These derive from the availability of empty Si dπ orbitals for back-donation from occupied O pπ orbitals yielding narrow symmetry determined distributions of third neighbor Si–O, and fourth neighbor O–O distances. These are segments of six member rings contributing to connected six-member rings with ~1 nm length scale within the MRO regime. The unique properties of non-crystalline SiO2 are explained by the encapsulation of six-member ring clusters by five- and seven-member rings on average in a compliant hard-soft nano-scaled inhomogeneous network. This network structure minimizes macroscopic strain, reducing intrinsic bonding defects as well as defect precursors. This inhomogeneous CRN is enabling for applications including thermally grown ~1.5 nm SiO2 layers for Si field effect transistor devices to optical components with centimeter dimensions. There are qualitatively similar length scales in nano-crystalline HfO2 and phase separated Hf silicates based on the primitive unit cell, rather than a ring structure. Hf oxide dielectrics have recently been used as replacement dielectrics for a new generation of Si and Si/Ge devices heralding a transition into nano-scale circuits and systems on a Si chip.

  15. High ink absorption performance of inkjet printing based on SiO2@Al13 core-shell composites

    Science.gov (United States)

    Chen, YiFan; Jiang, Bo; Liu, Li; Du, Yunzhe; Zhang, Tong; Zhao, LiWei; Huang, YuDong

    2018-04-01

    The increasing growth of the inkjet market makes the inkjet printing more necessary. A composite material based on core-shell structure has been developed and applied to prepare inkjet printing layer. In this contribution, the ink printing record layers based on SiO2@Al13 core-shell composite was elaborated. The prepared core-shell composite materials were characterized by X-ray photoelectron spectroscopy (XPS), zeta potential, X-ray diffraction (XRD), scanning electron microscopy (SEM). The results proved the presence of electrostatic adsorption between SiO2 molecules and Al13 molecules with the formation of the well-dispersed system. In addition, based on the adsorption and the liquid permeability analysis, SiO2@Al13 ink printing record layer achieved a relatively high ink uptake (2.5 gmm-1) and permeability (87%), respectively. The smoothness and glossiness of SiO2@Al13 record layers were higher than SiO2 record layers. The core-shell structure facilitated the dispersion of the silica, thereby improved its ink absorption performance and made the clear printed image. Thus, the proposed procedure based on SiO2@Al13 core-shell structure of dye particles could be applied as a promising strategy for inkjet printing.

  16. Synergetic scattering of SiO2 and Ag nanoparticles for light-trapping enhancement in organic bulk heterojunction

    Science.gov (United States)

    Yang, Huan; Ding, Qiuyu; Li, Ben Q.; Jiang, Xinbing; Zhang, Manman

    2018-02-01

    Though noble metal nanoparticles have been explored to enhance the performance of the organic solar cell, effect of dielectric nanoparticles, and coupled effect of dielectric and metal nanoparticles, have rarely been reported, if at all, on organic solar cell. This work reports an experimental study on synergetic scattering of SiO2 and Ag nanoparticles in a bulk organic heterojunction for the broadband light absorption enhancement. The wavelength scale SiO2 particles were arranged as a monolayer on the surface of the solar cell to guide incident light into the active layer and prolong the effective optical length of the entered energy. This is achieved by the excitation of whispering gallery modes in SiO2 nanoparticles and by leaky mode radiation. When small size Ag particles were incorporated into the transport layer of the solar cell, synergetic scattering of SiO2 and Ag nanoparticles is formed by coupling of the whispering gallery mode of closely arranged SiO2 particles atop and collaborative localized surface plasma resonance scattering of Ag nanoparticles dispersed in the transport layer. As a result, the performance of the organic solar cell is greatly enhanced and the short-circuit current density has an improvement of 42.47%. Therefore, the organic solar cell incorporated with SiO2 and Ag particles presents a meaningful strategy to achieve high energy-harvesting performance. [Figure not available: see fulltext.

  17. Preparation and Characterization of WS2@SiO2 and WS2@PANI Core-Shell Nanocomposites

    Directory of Open Access Journals (Sweden)

    Hagit Sade

    2018-03-01

    Full Text Available Two tungsten disulfide (WS2-based core-shell nanocomposites were fabricated using readily available reagents and simple procedures. The surface was pre-treated with a surfactant couple in a layer-by-layer approach, enabling good dispersion of the WS2 nanostructures in aqueous media and providing a template for the polymerization of a silica (SiO2 shell. After a Stöber-like reaction, a conformal silica coating was achieved. Inspired by the resulting nanocomposite, a second one was prepared by reacting the surfactant-modified WS2 nanostructures with aniline and an oxidizing agent in an aqueous medium. Here too, a conformal coating of polyaniline (PANI was obtained, giving a WS2@PANI nanocomposite. Both nanocomposites were analyzed by electron microscopy, energy dispersive X-ray spectroscopy (EDS and FTIR, verifying the core-shell structure and the character of shells. The silica shell was amorphous and mesoporous and the surface area of the composite increases with shell thickness. Polyaniline shells slightly differ in their morphologies dependent on the acid used in the polymerization process and are amorphous like the silica shell. Electron paramagnetic resonance (EPR spectroscopy of the WS2@PANI nanocomposite showed variation between bulk PANI and the PANI shell. These two nanocomposites have great potential to expand the use of transition metals dichalcogenides (TMDCs for new applications in different fields.

  18. High performance trench MOS barrier Schottky diode with high-k gate oxide

    Science.gov (United States)

    Zhai, Dong-Yuan; Zhu, Jun; Zhao, Yi; Cai, Yin-Fei; Shi, Yi; Zheng, You-Liao

    2015-07-01

    A novel trench MOS barrier Schottky diode (TMBS) device with a high-k material introduced into the gate insulator is reported, which is named high-k TMBS. By simulation with Medici, it is found that the high-k TMBS can have 19.8% lower leakage current while maintaining the same breakdown voltage and forward turn-on voltage compared with the conventional regular trench TMBS. Project supported by the National Basic Research Program of China (Grant No. 2011CBA00607), the National Natural Science Foundation of China (Grant Nos. 61106089 and 61376097), and the Zhejiang Provincial Natural Science Foundation of China (Grant No. LR14F040001).

  19. La cascarilla de arroz como fuente de SiO2

    Directory of Open Access Journals (Sweden)

    Claudia Andrea Arcos

    2007-01-01

    Full Text Available La cascarilla de arroz calcinada presenta un alto contenido de sílice. Este trabajo estudió la naturaleza de la fracción orgánica donde se nuclean los complejos de sílice y las condiciones óptimas para la síntesis de SiO2. La cascarilla de arroz y la sílice se analizaron utilizando microscopía electrónica de barrido (MEB, difracción de rayos de X (DRX, infrarrojo con transformada de Fourier (FTIR y análisis térmico diferencial (ATD. La cascarilla fue tratada con HCl para eliminar impurezas como Fe, Na, K, entre otros. Los resultados obtenidos muestran que en la parte externa de la cascarilla, constituida de celulosa, se nuclea la sílice, y el SiO2 obtenido de la misma es amorfo, con un alto valor de superficie específica (~277 m2/g, morfología no definida y tamaño nanométrico (< 200 nm.

  20. Amorphous Ge quantum dots embedded in SiO2 formed by low energy ion implantation

    International Nuclear Information System (INIS)

    Zhao, J. P.; Huang, D. X.; Jacobson, A. J.; Chen, Z. Y.; Makarenkov, B.; Chu, W. K.; Bahrim, B.; Rabalais, J. W.

    2008-01-01

    Under ultrahigh vacuum conditions, extremely small Ge nanodots embedded in SiO 2 , i.e., Ge-SiO 2 quantum dot composites, have been formed by ion implantation of 74 Ge + isotope into (0001) Z-cut quartz at a low kinetic energy of 9 keV using varying implantation temperatures. Transmission electron microscopy (TEM) images and micro-Raman scattering show that amorphous Ge nanodots are formed at all temperatures. The formation of amorphous Ge nanodots is different from reported crystalline Ge nanodot formation by high energy ion implantation followed by a necessary high temperature annealing process. At room temperature, a confined spatial distribution of the amorphous Ge nanodots can be obtained. Ge inward diffusion was found to be significantly enhanced by a synergetic effect of high implantation temperature and preferential sputtering of surface oxygen, which induced a much wider and deeper Ge nanodot distribution at elevated implantation temperature. The bimodal size distribution that is often observed in high energy implantation was not observed in the present study. Cross-sectional TEM observation and the depth profile of Ge atoms in SiO 2 obtained from x-ray photoelectron spectra revealed a critical Ge concentration for observable amorphous nanodot formation. The mechanism of formation of amorphous Ge nanodots and the change in spatial distribution with implantation temperature are discussed

  1. Systematic investigation of the reactive ion beam sputter deposition process of SiO2

    Science.gov (United States)

    Mateev, Maria; Lautenschläger, Thomas; Spemann, Daniel; Finzel, Annemarie; Gerlach, Jürgen W.; Frost, Frank; Bundesmann, Carsten

    2018-02-01

    Ion beam sputter deposition (IBSD) is an established physical vapour deposition technique that offers the opportunity to tailor the properties of film-forming particles and, consequently, film properties. This is because of two reasons: (i) ion generation and acceleration (ion source), sputtering (target) and film deposition (substrate) are locally separated. (ii) The angular and energy distribution of sputtered target atoms and scattered primary particles depend on ion incidence angle, ion energy, and ion species. Ion beam sputtering of a Si target in a reactive oxygen atmosphere was used to grow SiO2 films on silicon substrates. The sputtering geometry, ion energy and ion species were varied systematically and their influence on film properties was investigated. The SiO2 films are amorphous. The growth rate increases with increasing ion energy and ion incidence angle. Thickness, index of refraction, stoichiometry, mass density and surface roughness show a strong correlation with the sputtering geometry. A considerable amount of primary inert gas particles is found in the deposited films. The primary ion species also has an impact on the film properties, whereas the influence of the ion energy is rather small.

  2. Photon Irradiation Response on Ge and Al-Doped SiO2 Optical Fibres

    Science.gov (United States)

    Yaakob, Nor Haliza; Wagiran, Husin; Ramli, Ahmad Termizi; Ali, Hassan; Asni, Hazila

    2010-07-01

    Recently, research groups have reported a number of radiation effects on the applications of SiO2 optical fibres with possible use as dosimeter material because these optical fibre provide a good basis for medical radiation dosimetry. The objective of this study is to investigate the thermoluminescence response and fading characteristic for germanium and aluminium doped SiO2 optical fibres with photon irradiation. These optical fibres are placed in solid phantom and irradiated to 6 and 10 MV photon beam at dose ranging from 0.06 Gy to 0.24 Gy using Primus MLC 3339 linear accelerator at Hospital Sultan Ismail, Johor Bahru. In fading studies, the TL measurements were continued up to 14 days period. The optical fibres will produce glow curves whereby the information is then analyzed. Al and Ge-doped optical fibres have a linear dose-TL signal relationship that is proportionality between the TL signal and the doses. Comparison for TL response between different linear accelerator showed a good agreement because these optical fibres also have a linear dose-TL signal relationship even using different equipments.

  3. Effect of SiO2 coating in bolometric Ge light detectors for rare event searches

    International Nuclear Information System (INIS)

    Beeman, J.W.; Gentils, A.; Giuliani, A.; Mancuso, M.; Pessina, G.; Plantevin, O.; Rusconi, C.

    2013-01-01

    In germanium-based light detectors for scintillating bolometers, a SiO 2 anti-reflective coating is often applied on the side of the germanium wafer exposed to light with the aim to improve its light collection efficiency. In this paper, we report about a measurement, performed in the temperature range 25–35 mK, of the light-collection increase obtained thanks to this method, which resulted to be of the order of 20%. The procedure followed has been carefully selected in order to minimize systematic effects. The employed light sources have the same spectral features (peaking at ∼630nm wavelength) that will characterize future neutrinoless double beta decay experiments on the isotope 82 Se and based on ZnSe crystals, such as LUCIFER. The coupling between source and light detector reproduces the configuration used in scintillating bolometers. The present measurement clarifies the role of SiO 2 coating and describes a method and a set-up that can be extended to the study of other types of coatings and luminescent materials

  4. Effect of SiO2 coating in bolometric Ge light detectors for rare event searches

    Science.gov (United States)

    Beeman, J. W.; Gentils, A.; Giuliani, A.; Mancuso, M.; Pessina, G.; Plantevin, O.; Rusconi, C.

    2013-05-01

    In germanium-based light detectors for scintillating bolometers, a SiO2 anti-reflective coating is often applied on the side of the germanium wafer exposed to light with the aim to improve its light collection efficiency. In this paper, we report about a measurement, performed in the temperature range 25-35 mK, of the light-collection increase obtained thanks to this method, which resulted to be of the order of 20%. The procedure followed has been carefully selected in order to minimize systematic effects. The employed light sources have the same spectral features (peaking at ˜630 nm wavelength) that will characterize future neutrinoless double beta decay experiments on the isotope 82Se and based on ZnSe crystals, such as LUCIFER. The coupling between source and light detector reproduces the configuration used in scintillating bolometers. The present measurement clarifies the role of SiO2 coating and describes a method and a set-up that can be extended to the study of other types of coatings and luminescent materials.

  5. Surface Property and Stability of Transparent Superhydrophobic Coating Based on SiO2-Polyelectrolyte Multilayer

    Directory of Open Access Journals (Sweden)

    Sunisa JINDASUWAN

    2016-05-01

    Full Text Available Artificial superhydrophobic films were deposited onto a glass slide by performing layer-by-layer deposition of 3.5 bilayers of poly(allylamine hydrochloride/ poly(acrylic acid polyelectrolyte, followed by a layer of SiO2 nanoparticles of various amounts to enhance the surface roughness and a fluorosilane to reduce the surface free energy. Higher SiO2 content incorporated into the films resulted in rougher surface and higher water contact angle. The total surface free energy determined by using the Owens-Wendt equation dramatically decreased from 31.46 mJ·m-2 for the film having the relatively flat surface to only 1.16 mJ·m-2 for the film having the highest surface roughness of 60.2 ± 1.1 nm. All the films were optically transparent and had excellent adhesion based on the peel test. Indoor and accelerated weathering tests revealed good weathering stability.DOI: http://dx.doi.org/10.5755/j01.ms.22.2.12952

  6. Modification by SiO2 of Alumina Support for Light Alkane Dehydrogenation Catalysts

    Directory of Open Access Journals (Sweden)

    Giyjaz E. Bekmukhamedov

    2016-10-01

    Full Text Available Due to the continuously rising demand for C3–C5 olefins it is important to improve the performance of catalysts for dehydrogenation of light alkanes. In this work the effect of modification by SiO2 on the properties of the alumina support and the chromia-alumina catalyst was studied. SiO2 was introduced by impregnation of the support with a silica sol. To characterize the supports and the catalysts the following techniques were used: low-temperature nitrogen adsorption; IR-spectroscopy; magic angle spinning 29Si nuclear magnetic resonance; temperature programmed desorption and reduction; UV-Vis-, Raman- and electron paramagnetic resonance (EPR-spectroscopy. It was shown that the modifier in amounts of 2.5–7.5 wt % distributed on the support surface in the form of SiOx-islands diminishes the interaction between the alumina support and the chromate ions (precursor of the active component. As a result, polychromates are the compounds predominantly stabilized on the surface of the modified support; under thermal activation of the catalyst and are reduced to the amorphous Cr2O3. This in turn leads to an increase in the activity of the catalyst in the dehydrogenation of isobutane.

  7. Multifunctional Roles of TiO 2 Nanoparticles for Architecture of Complex Core−Shells and Hollow Spheres of SiO 2 −TiO 2 −Polyaniline System

    KAUST Repository

    Wang, Dan Ping

    2009-10-27

    Nanoparticles are often used as seeds to grow one-dimensional nanomaterials or as core materials to prepare core-shell nanostructures. On the other hand, the presynthesized inorganic nanoparticles can also be used as starting building blocks to prepare inorganic-polymer nanocomposites. In this work, we explore the roles of metal-oxide nanoparticles (anatase TiO2) in the area of constructional synthesis of highly complex core-shell and hollow sphere nanostructures comprising SiO2, TiO2, and polyaniline (PAN). In particular, multifunctional roles of oleate-surfactant-protected TiO2 nanoparticles have been revealed in this study: they provide starting sites for polymerization of aniline on the surface of SiO2 mesospheres; they land on the inner surface of polyaniline shell to form a secondary material phase; they work as initial crystalline seeds for homogeneous growth of interior TiO2 shell; and they serve as primary nanobuilding blocks to form exterior TiO2 shell on the polyaniline via self-assembly. With the assistance of the TiO2 nanoparticles, a total of six complex core-shell and hollow sphere nanocomposites (SiO 2/TiO2, SiO2/TiO2/PAN, SiO 2/TiO2/PAN/TiO2, TiO2/PAN, TiO 2/PAN/TiO2, and TiO2/TiO2) have been made in this work through controlled self-assembly, templating growth, polymerization, and homogeneous seeded growth. Applicability of these nanostructures in photocatalytic applications has also been demonstrated by our preliminary investigations. The easy separation of used catalysts after reaction seems to be advantageous because of relatively large external diameters of the lightweight nanocomposites. © 2009 American Chemical Society.

  8. Irradiation effect on back-gate graphene field-effect transistor

    Science.gov (United States)

    Chen, Xinlu; Srivastava, Ashok; Sharma, Ashwani K.; Mayberry, Clay

    2017-05-01

    The effects of irradiations on MOSFET and bipolar junction transistors are well known though irradiation mechanisms in two-dimensional graphene and related devices are still being investigated. In this work, we investigate irradiation mechanism based on a semi-empirical model for the graphene back-gate transistor and quantitatively analyze the irradiation influences on electrical properties of the device structure. The irradiation shifts the current which changes the region of device operation, degrades the mobility and increases the channel resistance which can increase the power dissipation. The main mechanism causing the degradation in performance of devices is the oxide trap charges near the SiO2/graphene interface and graphene layer traps charges.

  9. Formation Mechanism of SiO2-Type Inclusions in Si-Mn-Killed Steel Wires Containing Limited Aluminum Content

    Science.gov (United States)

    Wang, Kunpeng; Jiang, Min; Wang, Xinhua; Wang, Ying; Zhao, Haoqian; Cao, Zhanmin

    2015-10-01

    The origin, formation mechanism, and evolution of SiO2-type inclusions in Si-Mn-killed steel wires were studied by pilot trials with systematical samplings at the refining ladle, casting tundish, as-cast bloom, reheated bloom, and hot-rolled rods. It was found that the inclusions in tundish were well controlled in the low melting point region. By contrast, MnO-SiO2-Al2O3 inclusions in the as-cast bloom were with compositions located in the primary region of SiO2, and most CaO-SiO2-Al2O3-MnO inclusions lied in primary phase region of anorthite. Therefore, precipitation of SiO2 particles in MnO-SiO2-Al2O3 inclusions can be easier than in CaO-SiO2-Al2O3-MnO inclusions to form dual-phase inclusions in the as-cast bloom. Thermodynamic calculation by the software FactSage 6.4 (CRCT-ThermFact Inc., Montréal, Canada) showed that mass transfer between liquid steel and inclusions resulted in the rise of SiO2 content in inclusions from tundish to as-cast bloom and accelerated the precipitation of pure SiO2 phase in the formed MnO-SiO2-Al2O3 inclusions. As a result, the inclusions characterized by dual-phase structure of pure SiO2 in MnO-SiO2-Al2O3 matrix were observed in both as-cast and reheated blooms. Moreover, the ratio of such dual-phase SiO2-type inclusions witnessed an obvious increase from 0 to 25.4 pct before and after casting, whereas it changed little during the reheating and rolling. Therefore, it can be reasonably concluded that they were mainly formed during casting. Comparing the evolution of the inclusions composition and morphology in as-cast bloom and rolled products, a formation mechanism of the SiO2-type inclusions in wire rods was proposed, which included (1) precipitation of SiO2 in the formed MnO-SiO2-Al2O3 inclusion during casting and (2) solid-phase separation of the undeformed SiO2 precipitation from its softer MnO-SiO2-Al2O3 matrix during multipass rolling.

  10. Solution processed lanthanum aluminate gate dielectrics for use in metal oxide-based thin film transistors

    Energy Technology Data Exchange (ETDEWEB)

    Esro, M.; Adamopoulos, G., E-mail: g.adamopoulos@lancaster.ac.uk [Engineering Department, Lancaster University, Lancaster LA1 4YR (United Kingdom); Mazzocco, R.; Kolosov, O.; Krier, A. [Physics Department, Lancaster University, Lancaster, LA1 4YB (United Kingdom); Vourlias, G. [Physics Department, Aristotle University of Thessaloniki, 54124 Thessaloniki (Greece); Milne, W. I. [Department of Engineering, University of Cambridge, 9 JJ Thomson Avenue, Cambridge CB3 0FA (United Kingdom); Department of Electrical and Computing Engineering, University of Canterbury, 4800 Christchurch (New Zealand)

    2015-05-18

    We report on ZnO-based thin-film transistors (TFTs) employing lanthanum aluminate gate dielectrics (La{sub x}Al{sub 1−x}O{sub y}) grown by spray pyrolysis in ambient atmosphere at 440 °C. The structural, electronic, optical, morphological, and electrical properties of the La{sub x}Al{sub 1−x}O{sub y} films and devices as a function of the lanthanum to aluminium atomic ratio were investigated using a wide range of characterization techniques such as UV-visible absorption spectroscopy, impedance spectroscopy, spectroscopic ellipsometry, atomic force microscopy, x-ray diffraction, and field-effect measurements. As-deposited LaAlO{sub y} dielectrics exhibit a wide band gap (∼6.18 eV), high dielectric constant (k ∼ 16), low roughness (∼1.9 nm), and very low leakage currents (<3 nA/cm{sup 2}). TFTs employing solution processed LaAlO{sub y} gate dielectrics and ZnO semiconducting channels exhibit excellent electron transport characteristics with hysteresis-free operation, low operation voltages (∼10 V), high on/off current modulation ratio of >10{sup 6}, subthreshold swing of ∼650 mV dec{sup −1}, and electron mobility of ∼12 cm{sup 2} V{sup −1} s{sup −1}.

  11. A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under positive gate bias stress

    NARCIS (Netherlands)

    Niang, K.M.; Barquinha, P.M.C.; Martins, R.F.P.; Cobb, B.; Powell, M.J.; Flewitt, A.J.

    2016-01-01

    Thin film transistors (TFTs) employing an amorphous indium gallium zinc oxide (a-IGZO) channel layer exhibit a positive shift in the threshold voltage under the application of positive gate bias stress (PBS). The time and temperature dependence of the threshold voltage shift was measured and

  12. Investigation of the SiO2/Si(1 0 0) interface structure by means of angle-scanned photoelectron spectroscopy and diffraction

    International Nuclear Information System (INIS)

    Dreiner, S.; Schuermann, M.; Westphal, C.

    2004-01-01

    The local environment of Si at the interface between a thermally grown SiO 2 film and Si(1 0 0) was studied by angle-scanned photoelectron spectroscopy and diffraction. Si 2p core-level spectra containing chemically shifted components were recorded. These components were deconvoluted by least squares fitting and assigned to different Si oxidation states. The angular dependence of the photoelectron intensity was obtained from the least squares fit results. A simple statistical model was developed to describe the population and depth distribution of the different suboxide species. Using a simple electron attenuation scheme we can simulate the photoemission polar angle dependence of the various Si oxidation states within the model. The fitting of these model curves to the experimental data results in parameters which indicate a Si-O-Si bridge-bonded interface structure

  13. SiO2 and ZnO Dopants in 3D Printed TCP Scaffolds Enhances Osteogenesis and Angiogenesis in vivo

    Science.gov (United States)

    Fielding, Gary; Bose, Susmita

    2013-01-01

    Calcium phosphate (CaP) scaffolds with three dimensionally (3D) interconnected pores play an important role in mechanical interlocking and biological fixation in bone implant applications. CaPs alone, however, are only osteoconductive (ability to guide bone growth). Much attention has been given to the incorporation of biologics and pharmacologics to add osteoinductive (ability to cause new bone growth) properties to CaP materials. Because biologics and pharmacologics are generally delicate compounds and also subject to increased regulatory scrutiny, there is a need to investigate alternative methods to introduce osteoinductivity to CaP materials. In this study silica (SiO2) and zinc oxide (ZnO) have been incorporated in to 3D printed β-tricalcium phosphate (TCP) scaffolds to investigate their potential to trigger osteoinduction in vivo. Silicon and zinc are trace elements that are common to bone and have also been shown to have many beneficial properties from increased bone regeneration to angiogenesis. Implants were placed in bicortical femur defects introduced to a murine model for up to 16 weeks. Addition of dopants into TCP increased the capacity for new early bone formation by modulating collagen I production and osteocalcin production. Neovascularization was found to be up to three times more than the pure TCP control group. The findings from this study indicate that the combination of SiO2 and ZnO dopants in TCP may be a viable alternative to introduce osteoinductive properties to CaPs. PMID:23871941

  14. ZnO nanocrystals on SiO2/Si surfaces thermally cleaned in ultrahigh vacuum and characterized using spectroscopic photoemission and low energy electron microscopy

    International Nuclear Information System (INIS)

    Ericsson, Leif K. E.; Magnusson, Kjell O.; Zakharov, Alexei A.

    2010-01-01

    Thermal cleaning in ultrahigh vacuum of ZnO nanocrystals distributed on SiO 2 /Si surfaces has been studied using spectroscopic photoemission and low energy electron microscopy (SPELEEM). This study thus concern weakly bound ZnO nanocrystals covering only 5%-10% of the substrate. Chemical properties, crystallinity, and distribution of nanocrystals are used to correlate images acquired with the different techniques showing excellent correspondence. The nanocrystals are shown to be clean enough after thermal cleaning at 650 deg. C to be imaged by LEEM and x-ray PEEM as well as chemically analyzed by site selective x-ray photoelectron spectroscopy (μ-XPS). μ-XPS shows a sharp Zn 3d peak and resolve differences in O 1s states in oxides. The strong LEEM reflections together with the obtained chemical information indicates that the ZnO nanocrystals were thermally cleaned, but do not indicate any decomposition of the nanocrystals. μ-XPS was also used to determine the thickness of SiO 2 on Si. This article is the first to our knowledge where the versatile technique SPELEEM has been used to characterize ZnO nanocrystals.

  15. Lu2O3-SiO2-ZrO2 Coatings for Environmental Barrier Application by Solution Precursor Plasma Spraying and Influence of Precursor Chemistry

    Science.gov (United States)

    Darthout, Émilien; Quet, Aurélie; Braidy, Nadi; Gitzhofer, François

    2014-02-01

    As environmental barrier coatings are subjected to thermal stress in gas turbine engines, the introduction of a secondary phase as zircon (ZrSiO4) is likely to increase the stress resistance of Lu2Si2O7 coatings generated by induction plasma spraying using liquid precursors. In a first step, precursor chemistry effect is investigated by the synthesis of ZrO2-SiO2 nanopowders by induction plasma nanopowder synthesis technique. Tetraethyl orthosilicate (TEOS) as silicon precursor and zirconium oxynitrate and zirconium ethoxide as zirconium precursors are mixed in ethanol and produce a mixture of tetragonal zirconia and amorphous silica nanoparticles. The use of zirconium ethoxide precursor results in zirconia particles with diameter below 50 nm because of exothermic thermal decomposition of the ethoxide and its high boiling point with respect to solvent, while larger particles are formed when zirconium oxynitrate is employed. The formation temperature of zircon from zirconia and silica oxides is found at 1425 °C. Second, coatings are synthesized in Lu2O3-ZrO2-SiO2 system. After heat treatment, the doping effect of lutetium on zirconia grains totally inhibits the zircon formation. Dense coatings are obtained with the use of zirconium ethoxide because denser particles with a homogeneous diameter distribution constitute the coating.

  16. Efecto de la adición de SiO2 sobre las propiedades magnéticas de ferritas de bario

    Directory of Open Access Journals (Sweden)

    Rosales, M. I.

    2000-04-01

    Full Text Available The effect of SiO2 additions, from 0.2% to 10% in weight, on the magnetic and structural properties of barium ferrite, prepared by the chemical coprecipitation method, is reported. It was observed that the effect of silicon oxide on the ferrite is to drag the grain growth and to decompose the ferrite into hematite and, perhaps, a barium silicate.Se estudia el efecto de la influencia que tiene la adición de SiO2, en cantidades del 0.2% al 10% en peso, sobre las propiedades magnéticas y estructurales de las ferritas de bario preparadas por el método de coprecipitación química. Se observó que el efecto del óxido de silicio sobre la ferrita de bario fue el de actuar como inhibidor para el crecimiento del grano y el de descomponer la ferrita en hematita y, posiblemente, en un silicato de bario.

  17. Facile preparation of SiO2/TiO2 composite monolithic capillary column and its application in enrichment of phosphopeptides.

    Science.gov (United States)

    Wang, Shao-Ting; Wang, Meng-Ya; Su, Xin; Yuan, Bi-Feng; Feng, Yu-Qi

    2012-09-18

    A novel SiO(2)/TiO(2) composite monolithic capillary column was prepared by sol-gel technology and successfully applied to enrich phosphopeptides as a metal oxide affinity chromatography (MOAC) material. For the monolith preparation, tetramethoxysilane (TMOS) and tetrabutoxytitanium (TBOT) were used as silica and titania source, respectively, and glycerol was introduced to attenuate the activity of titanium precursor, which provided a mild synthetic condition. The prepared monolith was characterized by energy dispersive X-ray spectroscopy (EDX) and X-ray diffraction (XRD). The results revealed an approximate 1/2 molar ratio of titanium to silica as well as an atom-scale homogeneity in the framework. The scanning electron microscopy (SEM) results demonstrated an excellent anchorage between the column and the inner capillary wall, and nitrogen adsorption-desorption experiments showed a bimodal porosity with a narrow mesopore distribution around 3.6 nm. The prepared monolith was then applied for selective enrichment of phosphopeptides from the digestion mixture of phosphoproteins and bovine serum albumin (BSA) as well as human blood serum, nonfat milk, and egg white using an in-tube solid phase microextraction (SPME) system. Our results showed that SiO(2)/TiO(2) composite monolithic capillary column could efficiently enrich the phosphopeptides from complex matrixes. To the best of our knowledge, this is the first attempt for preparing the silica-metal composite monolithic capillary column, which offers the promising application of the monolith on phosphoproteomics study.

  18. Effect of input power and gas pressure on the roughening and selective etching of SiO2/Si surfaces in reactive plasmas

    International Nuclear Information System (INIS)

    Zhong, X. X.; Huang, X. Z.; Tam, E.; Ostrikov, K.; Colpo, P.; Rossi, F.

    2010-01-01

    We report on the application low-temperature plasmas for roughening Si surfaces which is becoming increasingly important for a number of applications ranging from Si quantum dots to cell and protein attachment for devices such as 'laboratory on a chip' and sensors. It is a requirement that Si surface roughening is scalable and is a single-step process. It is shown that the removal of naturally forming SiO 2 can be used to assist in the roughening of the surface using a low-temperature plasma-based etching approach, similar to the commonly used in semiconductor micromanufacturing. It is demonstrated that the selectivity of SiO 2 /Si etching can be easily controlled by tuning the plasma power, working gas pressure, and other discharge parameters. The achieved selectivity ranges from 0.4 to 25.2 thus providing an effective means for the control of surface roughness of Si during the oxide layer removal, which is required for many advance applications in bio- and nanotechnology.

  19. Sorption kinetics of cesium on ZrO2 and ZrO2-SiO2-TiO2 microspheres

    International Nuclear Information System (INIS)

    Tel, H.; Altas, Y.; Guer, F.; Ugur, A.

    2010-01-01

    ZrO 2 and ZrO 2 -SiO 2 -TiO 2 (with 1:1:1 mol ratio) microspheres have been prepared by the sol-gel method and characterized to study the sorption kinetics of cesium. The effect of pH on the adsorption capacity was determined for both type sorbents and the maximum adsorption percentage of cesium was observed at pH 10. To elucidate the kinetics of the ion-exchange reaction on pure and ternary oxide microspheres, the isotopic exchange rates of cesium ions between both types of sorbent microspheres and aqueous solution were measured radiochemically and compared with each other. The diffusion coefficients of Cs + ion for ZrO 2 and ZrO 2 -SiO 2 -TiO 2 sorbent microspheres at pH 10 were calculated as 3.648 x 10 -8 m 2 s -1 and 6.383 x 10 -8 m 2 s -1 , respectively, under particle diffusion controlled conditions. (orig.)

  20. Formation of thin DLC films on SiO2/Si substrate using FCVAD technique

    International Nuclear Information System (INIS)

    Bootkul, D.; Intarasiri, S.; Aramwit, C.; Tippawan, U.; Yu, L.D.

    2013-01-01

    Diamond-like carbon (DLC) films deposited on SiO 2 /Si substrate are attractive for novel sensitive and selective chemical sensors. According to the almost never ending of size reduction, a nm-thickness layer of the film is greatly required. However, formation of such a very thin DLC film on SiO 2 /Si substrate is challenging. In this experiment, DLC films were formed using our in-house Filtered Cathodic Vacuum Arc Deposition (FCVAD) facility by varying the bias voltage of 0 V, −250 V and −450 V with the arc voltage of 350 V, 450 V, 550 V, 650 V and 750 V for 10 min. Raman spectroscopy was applied for characterization of the film qualities and Transmission Electron Microscopy (TEM) was applied for cross sectional analysis. Results showed that films of thickness ranging from 10–50 nm were easily acquired depending on deposition conditions. Deconvolution of Raman spectra of these samples revealed that, when fixing the substrate bias but increasing the arc voltage from 350 to 750 V, the ratio between D-peak and G-peak intensity, namely I D /I G ratio, tended to reduce up to the arc voltage of 450 V, then increased up to the arc voltage of 650 V and finally decreased again. On the other hand, when fixing the arc voltage, the I D /I G ratio tended to decrease continuously as the increasing of bias voltage. It can be concluded that the bonding structure would evolve from a graphitic-like structure to a diamond-like structure as the substrate bias increases. Additionally, the sp 3 site should be maximized at the arc voltage ∼450 V for fixed bias voltage. It is expected that, at −450 V bias and 450 V arc, sp 3 fractions could be higher than 60%. However, in some cases, e.g. at low arc voltages, voids formed between the film and the amorphous SiO 2 substrate. Electron energy loss spectroscopy (EELS) of the C edge across the DLC indicated that the thicker DLC film had uniform chemistry and structure, whereas the thin DLC film showed changes in the edge shape, indicating a gradual change in its properties between the edges and the core

  1. Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

    International Nuclear Information System (INIS)

    Ceschia, M.; Paccagnella, A.; Cester, A.; Scarpa, A.

    1998-01-01

    Low-field leakage current has been measured in thin oxides after exposure to ionizing radiation. This Radiation Induced Leakage Current (RILC) can be described as an inelastic tunneling process mediated by neutral traps in the oxide, with an energy loss of about 1 eV. The neutral trap distribution is influenced by the oxide field applied during irradiation, thus indicating that the precursors of the neutral defects are charged, likely being defects associated to trapped holes. The maximum leakage current is found under zero-field condition during irradiation, and it rapidly decreases as the field is enhanced, due to a displacement of the defect distribution across the oxide towards the cathodic interface. The RILC kinetics are linear with the cumulative dose, in contrast with the power law found on electrically stressed devices

  2. INVESTIGATION ON PHYSICAL AND ELECTRICAL PROPERTIES OF THE SiO2-ZnO NANOCOMPOSITE AT DIFFERENT COMPOSITION MIXINGS

    Directory of Open Access Journals (Sweden)

    Moh. Sinol

    2018-01-01

    Full Text Available Physical and electrical properties of The SiO2-ZnO mixing at different compositions were investigated. The experiment used simple mixing method at the sintering temperature 600oC. It was used the composition mixing ratio of SiO2:ZnO ie. 0:10; 7:3; 5:5; 3:7; and 10:0 (%Wt. Based on X-Ray Diffraction (XRD results, it obtained that a new phase in each sample was not formed even though having different diffraction peak. The mixing ratio of SiO2: ZnO nanocomposite (7:3 %wt had the biggest grain size (77,92 nm, the highest dielectric constant (3.00E+05 and the smallest conductivity (0,726549 (Ωm-1. On the other side, the mixing ratio of SiO2: ZnO nanocomposite (5:5 %wt had the smallest grain size (35.42nm, dielectric constant (3.00E+2 and the highest conductivity (25.36729  (Ωm-1. It can be concluded that the difference of composition ratio offered the change on both physical and electrical properties of SiO2-ZnO nanocomposite.

  3. Effect of SiO2, PVA and glycerol concentrations on chemical and mechanical properties of alginate-based films.

    Science.gov (United States)

    Yang, Manli; Shi, Jinsheng; Xia, Yanzhi

    2018-02-01

    Sodium alginate (SA)/polyvinyl alcohol (PVA)/SiO 2 nanocomposite films were prepared by in situ polymerization through solution casting and solvent evaporation. The effect of different SA/PVA ratios, SiO 2 , and glycerol content on the mechanical properties, water content, water solubility, and water vapor permeability were studied. The nanocomposite films were characterized by Fourier transform infrared, X-ray diffraction, scanning electron microscopy, transmission electron microscopy, and thermal stability (thermogravimetric analysis/differential thermogravimetry) analyses. The nanocomposites showed the highest values of mechanical properties, such as SA/PVA ratio, SiO 2 , and glycerol content was 7:3, 6wt.%, and 0.25g/g SA, respectively. The tensile strength and elongation at break (E%) of the nanocomposites increased by 525.7% and 90.7%, respectively, compared with those of the pure alginate film. The Fourier transform infrared spectra showed a new SiOC band formed in the SA/PVA/SiO 2 nanocomposite film. The scanning electron microscopy image revealed good adhesion between SiO 2 and SA/PVA matrix. After the incorporation of PVA and SiO 2 , the water resistance of the SA/PVA/SiO 2 nanocomposite film was markedly improved. Transparency decreased with increasing PVA content but was enhanced by adding SiO 2 . Copyright © 2017. Published by Elsevier B.V.

  4. Genomic and functional analysis of Vibrio phage SIO-2 reveals novel insights into ecology and evolution of marine siphoviruses.

    Science.gov (United States)

    Baudoux, A-C; Hendrix, R W; Lander, G C; Bailly, X; Podell, S; Paillard, C; Johnson, J E; Potter, C S; Carragher, B; Azam, F

    2012-08-01

    We report on a genomic and functional analysis of a novel marine siphovirus, the Vibrio phage SIO-2. This phage is lytic for related Vibrio species of great ecological interest including the broadly antagonistic bacterium Vibrio sp. SWAT3 as well as notable members of the Harveyi clade (V.harveyi ATTC BAA-1116 and V.campbellii ATCC 25920). Vibrio phage SIO-2 has a circularly permuted genome of 80598 bp, which displays unusual features. This genome is larger than that of most known siphoviruses and only 38 of the 116 predicted proteins had homologues in databases. Another divergence is manifest by the origin of core genes, most of which share robust similarities with unrelated viruses and bacteria spanning a wide range of phyla. These core genes are arranged in the same order as in most bacteriophages but they are unusually interspaced at two places with insertions of DNA comprising a high density of uncharacterized genes. The acquisition of these DNA inserts is associated with morphological variation of SIO-2 capsid, which assembles as a large (80 nm) shell with a novel T=12 symmetry. These atypical structural features confer on SIO-2 a remarkable stability to a variety of physical, chemical and environmental factors. Given this high level of functional and genomic novelty, SIO-2 emerges as a model of considerable interest in ecological and evolutionary studies. © 2012 Society for Applied Microbiology and Blackwell Publishing Ltd.

  5. Tunable Anisotropic Absorption of Ag-Embedded SiO2 Thin Films by Oblique Angle Deposition

    International Nuclear Information System (INIS)

    Xiu-Di, Xiao; Guo-Ping, Dong; Jian-Da, Shao; Zheng-Xiu, Fan; Hong-Bo, He; Hong-Ji, Qi

    2009-01-01

    Ag-embedded SiO 2 thin films are prepared by oblique angle deposition. Through field emission scanning electron microscopy (SEM), an orientated slanted columnar structure is observed. Energy-dispersive x-ray (EDX) analysis shows the Ag concentration is about 3% in the anisotropic SiO 2 matrix. Anisotropic surface plasma resonance (SPR) absorption is observed in the Ag-embedded SiO 2 thin films, which is dependent on polarization state and incidence angle of two orthogonal polarized lights and the deposition angle. This means that optical properties and anisotropic SPR absorption can be tunable in Ag-embedded SiO 2 thin films. Broadband polarization splitting is also observed and the transmission ratio T p /T s between p- and s-polarized lights is up to 2.7 for thin films deposited at α = 70°, which means that Ag-embedded SiO 2 thin films are a promising candidate for thin film polarizers. (condensed matter: structure, mechanical and thermal properties)

  6. Magnesium Removal from an Aluminum A-332 Molten Alloy Using Enriched Zeolite with Nanoparticles of SiO2

    Directory of Open Access Journals (Sweden)

    R. Muñoz-Arroyo

    2014-01-01

    Full Text Available In order to improve the Mg removal from an A-380 molten alloy, mixtures of zeolite and SiO2 nanoparticles (SiO2(NPs were tested. Zeolite was enriched with 2.5, 5, 7.5, 10, or 12.5 wt-% of amorphous SiO2(NPs. The SiO2(NPs and zeolite were mixed for 30 min in ethanol for each experiment and then dried in a furnace at 80°C for 12 h. The enriched zeolites were analyzed by scanning electron microscopy, transmission electron microscopy, and N2 gas adsorption analysis. The Mg removal was carried out injecting each mixture into the molten aluminum alloy at 750°C using argon. The Mg content of the molten alloy was measured after different periods of the injection time. Zeolites enriched with 2.5 and 5 wt-% of SiO2(NPs were demonstrated to be the better mixtures, removing Mg from an initial content of 1.6 to a final content of 0.0002 and 0.0101 wt-%, respectively, in 45 min of injection.

  7. Hydroxyapatite-TiO2-SiO2-Coated 316L Stainless Steel for Biomedical Application

    Science.gov (United States)

    Sidane, Djahida; Khireddine, Hafit; Bir, Fatima; Yala, Sabeha; Montagne, Alex; Chicot, Didier

    2017-07-01

    This study investigated the effectiveness of titania (TiO2) as a reinforcing phase in the hydroxyapatite (HAP) coating and silica (SiO2) single layer as a bond coat between the TiO2-reinforced hydroxyapatite (TiO2/HAP) top layer and 316L stainless steel (316L SS) substrate on the corrosion resistance and mechanical properties of the underlying 316L SS metallic implant. Single layer of SiO2 film was first deposited on 316L SS substrate and studied separately. Water contact angle measurements, X-ray photoelectron spectroscopy, and Fourier transform infrared spectrophotometer analysis were used to evaluate the hydroxyl group reactivity at the SiO2 outer surface. The microstructural and morphological results showed that the reinforcement of HAP coating with TiO2 and SiO2 reduced the crystallite size and the roughness surface. Indeed, the deposition of 50 vol pct TiO2-reinforced hydroxyapatite layer enhanced the hardness and the elastic modulus of the HAP coating, and the introduction of SiO2 inner layer on the surface of the 316L SS allowed the improvement of the bonding strength and the corrosion resistance as confirmed by scratch studies, nanoindentation, and cyclic voltammetry tests.

  8. In Vitro and In Vivo Short-Term Pulmonary Toxicity of Differently Sized Colloidal Amorphous SiO2

    Directory of Open Access Journals (Sweden)

    Martin Wiemann

    2018-03-01

    Full Text Available In vitro prediction of inflammatory lung effects of well-dispersed nanomaterials is challenging. Here, the in vitro effects of four colloidal amorphous SiO2 nanomaterials that differed only by their primary particle size (9, 15, 30, and 55 nm were analyzed using the rat NR8383 alveolar macrophage (AM assay. Data were compared to effects of single doses of 15 nm and 55 nm SiO2 intratracheally instilled in rat lungs. In vitro, all four elicited the release of concentration-dependent lactate dehydrogenase, β-glucuronidase, and tumor necrosis factor alpha, and the two smaller materials also released H2O2. All effects were size-dependent. Since the colloidal SiO2 remained well-dispersed in serum-free in vitro conditions, effective particle concentrations reaching the cells were estimated using different models. Evaluating the effective concentration–based in vitro effects using the Decision-making framework for the grouping and testing of nanomaterials, all four nanomaterials were assigned as “active.” This assignment and the size dependency of effects were consistent with the outcomes of intratracheal instillation studies and available short-term rat inhalation data for 15 nm SiO2. The study confirms the applicability of the NR8383 AM assay to assessing colloidal SiO2 but underlines the need to estimate and consider the effective concentration of such well-dispersed test materials.

  9. Effect of Si and SiO2 Substrates on the Geometries of As-Grown Carbon Coils

    Directory of Open Access Journals (Sweden)

    Semi Park

    2012-01-01

    Full Text Available Carbon coils could be synthesized using C2H2/H2 as source gases and SF6 as an incorporated additive gas under thermal chemical vapor deposition system. Si substrate, SiO2 thin film deposited Si substrate (SiO2 substrate, and quartz substrate were employed to elucidate the effect of substrate on the formation of carbon coils. The characteristics (formation densities, morphologies, and geometries of the deposited carbon coils on the substrate were investigated. In case of Si substrate, the microsized carbon coils were dominant on the substrate surface. While, in case of SiO2 substrate, the nanosized carbon coils were prevailing on the substrate surface. The surface morphologies of samples were investigated step by step during the reaction process. The cause for the different geometry formation of carbon coils according to the different substrates was discussed in association with the different thermal expansion coefficient values of Si and SiO2 substrates and the different etched characteristics of Si and SiO2 substrates by SF6 + H2 flow.

  10. Optical characterization of glutamate dehydrogenase monolayers chemisorbed on SiO2

    Science.gov (United States)

    Pompa, P. P.; Blasi, L.; Longo, L.; Cingolani, R.; Ciccarella, G.; Vasapollo, G.; Rinaldi, R.; Rizzello, A.; Storelli, C.; Maffia, M.

    2003-04-01

    This paper describes the formation of glutamate dehydrogenase monolayers on silicon dioxide, and their characterization by means of physical techniques, i.e., fluorescence spectroscopy and Fourier-transform infrared spectroscopy. Detailed investigations of the intrinsic stability of native proteins in solution were carried out to elucidate the occurrence of conformational changes induced by the immobilization procedure. The enzyme monolayers were deposited on SiO2 after preexposing silicon surfaces to 3-aminopropyltriethoxysilane and reacting the silylated surfaces with glutaric dialdehyde. The optical characterization demonstrates that the immobilization does not interfere with the fold pattern of the native enzyme. In addition, fluorescence spectroscopy, thermal denaturation, and quenching studies performed on the enzyme in solution well describe the folding and unfolding properties of glutamate dehydrogenase. The photophysical studies reported here are relevant for nanobioelectronics applications requiring protein immobilization on a chip.

  11. Mechanical and ageing properties of SiO2 - doped Y-TZP ceramics

    International Nuclear Information System (INIS)

    Ramesh, S.

    2001-01-01

    The effects of small additions of silica (SiO 2 ) up to 0.5 wt5 on the mechanical and ageing properties of commercial 2.5 mol% yttria-tetragonal zirconia polycrystals (Y-TZP) ceramics have been investigated. Low temperature hydrothermal ageing at 120 o C was conducted in steam in an autoclave at 2 bar up to 400 hours. It was found that the presence of a glassy grain boundary acted as a sintering aid for Y-TZP. As the silica content increased, the sinterability of the ceramic significantly improved, but this was accompanied by an undesirable microstructural change such as abnormal grain growth. This abnormality was believed to be associated with the formation of cubic phase. In addition, it was also found that the ageing resistance of Y-TZP deteriorated with increasing silica content. (Author)

  12. Synthesis of optical waveguides in SiO2 by silver ion implantation

    Science.gov (United States)

    Márquez, H.; Salazar, D.; Rangel-Rojo, R.; Angel-Valenzuela, J. L.; Vázquez, G. V.; Flores-Romero, E.; Rodríguez-Fernández, L.; Oliver, A.

    2013-03-01

    Optical waveguides have been obtained by silver ion implantation on fused silica substrates. Silver ion implantation profiles were calculated in a SiO2 matrix with different energies of implantation from 125 keV to 10 MeV. Refractive index change (Δn) of the ion implanted waveguides was calculated as a function of their chemical composition. Optical absorption spectra of waveguides obtained by 9 MeV silver ion implantation, at a dose of 5 × 1016 ions/cm2, exhibit the typical absorption band associated to the surface plasmon resonance of silver nanoparticles. Effective refractive indices of the propagation modes and waveguide propagation losses of silver ion implanted waveguides are also presented.

  13. Stability and kinetics of point defects in SiO2 and in SiC

    International Nuclear Information System (INIS)

    Roma, G.

    2012-01-01

    This document is conceived as an overview of Guido Roma's research achievements on defects stability and kinetics in two materials of interest in nuclear science and for many other application domains: silicon dioxide and silicon carbide. An extended summary in french is followed by the main document, in english. Chapter 1 describes the context, introduces the approach and explains the choice of silicon dioxide and silicon carbide. Chapter 2 discusses several approximations and specific issues of the application of Density Functional Theory to point defects in non-metallic materials for the study of defects energetics and diffusion. Chapter 3 is devoted to native defects in silicon dioxide and the understanding of self-diffusion in crystalline and amorphous SiO 2 . Chapter 4 summarises the results on native defects and palladium impurities in silicon carbide. A conclusion, including suggestions for future developments, closes the main part of the document. (author) [fr

  14. Positive magnetoresistance in Co40Fe40B20/SiO2/Si heterostructure

    KAUST Repository

    Zhang, Y.

    2016-07-20

    Current-perpendicular-to-plane electronic transport properties and magnetoresistance of amorphous Co40Fe40B20/SiO2/Si heterostructures are investigated systematically. A backward diode-like rectifying behavior was observed due to the formation of a Schottky barrier between Co40Fe40B20 and Si. The junction resistance shows a metal-insulator transition with decreasing temperature in both the forward and reverse ranges. A large positive magnetoresistance (MR) of ∼2300% appears at 200 K. The positive MR can be attributed to the magnetic-field-controlled impact ionization process of carriers. MR shows a temperature-peak-type character under a constant bias current, which is related to the spin-dependent barrier in the Si near the interface. © CopyrightEPLA, 2016.

  15. Electrical properties of SiO2-based graphene under monochromatic visible light irradiation

    Science.gov (United States)

    Li, Xiangdi; Liu, Xianming; Cao, Xueying; Zhang, Peng; Lei, Xiaohua; Chen, Weimin

    2017-08-01

    The purpose of this study is to investigate the electrical properties of graphene transparent conductive film under visible light irradiation. Sample in the study is chemical vapor deposition (CVD) growth graphene on the surface of copper foils and then transferred to the SiO2 substrate. Three monochromatic visible lights with wavelength of 635nm, 520nm and 450nm representing red (R), green (G) and blue (B) lights are used as irradiation sources. Results show that the graphene resistances increase slowly under light irradiation with all the three different wavelengths, while decrease slowly after the light is switched off. Light irradiation with higher power density will induce larger relative resistance change. When graphene is irradiated at the same density, blue light irradiation may result in the largest resistance change.

  16. Acidity and alkali metal adsorption on the SiO2-aqueous solution interface.

    Science.gov (United States)

    Zuyi, Tao; Hongxia, Zhang

    2002-08-01

    The intrinsic deprotonation constant (pK(a(2))(int)) and the intrinsic ion exchange constants (pK(Me(+))(int)) of Li(+), Na(+), and K(+) on SiO(2) were uniquely determined at 30 degrees C by using the potentiometric titration data, the Gouy-Chapman-Stern-Grahame (GSCG) model for the structure of the electrical double-layer (edl) and the double-extrapolation method. The values of these constants were pK(a(2))(int) = 6.57, pK(Li(+))(int) = pK(Na(+))(int) = pK(K(+))(int) = 5.61. The chemical meaning of intrinsic equilibrium constants and the equality in the values of pK(Li(+))(int), pK(Na(+))(int) and pK(K(+))(int) were discussed.

  17. Defects in electron irradiated vitreous SiO2 probed by positron annihiliation

    International Nuclear Information System (INIS)

    Uedono, Akira; Tanigawa, Shoichiro; Kawano, Takao; Itoh, Hisayoshi

    1994-01-01

    Defects in 3 MeV electron irradiated vitreous SiO 2 (v-SiO 2 ) were probed by the positron annihilation technique. For unirradiated v-SiO 2 specimens, almost all positrons were found to annihilate from positronium (Ps) states. This high formation probability of Ps was attributed to the trapping of positrons by open-space defects. The formation probability of Ps was decreased by the electron irradiation. The observed inhibition of the Ps formation was attributed to the trapping of positrons by point defects introduced and/or activated by the irradiation. From measurements of the lifetime distribution of Ps, it was found that, by the electron irradiation, the mean size of open-space defects was decreased and the size distribution of such defects was broadened. (Author)

  18. SiO2 sol-gel films after ammonia and heat two-step treatments

    International Nuclear Information System (INIS)

    Zhang Chunlai; Wang Biyi; Tian Dongbin; Yin Wei; Jiang Xiaodong; Yuan Xiaodong; Yan Lianghong; Zhang Hongliang; Zhao Songnan; Lv Haibing

    2008-01-01

    SiO 2 thin films were deposited using tetraethoxylsilane as precursor, ammonia as catalyst on K9 glass by sol-gel method. These films were post-treated by ammonia and heat. The properties of the coatings were characterized by ellipsometer, UV-vis spectrophotometry, FTIR-spectroscopy, scanning probe microscope and contact angle measurement apparatus. The resuits indicate that the thickness of the films with ammonia and heat treatment tend to decrease. Both the refractive index and water contact angle increase after ammonia treatment. However, they both decrease after heat treatment. The former increases by 0.236 for the first step, then decreases by 0.202 for the second. The latter increases to 58.92 degree, then decreases to 38.07 degree. The transmittance of the coatings turn to be better and continuously shift to short wave by UV-vis spectrophotometry. The surface becomes smoother by AFM after the two-step treatment. (authors)

  19. Ultrasonic-Assisted Synthesis of Two t-Butoxycarbonylamino Cephalosporin Intermediates on SiO2

    Directory of Open Access Journals (Sweden)

    Feng Xue

    2016-01-01

    Full Text Available Herein, we describe a facile and high efficient strategy for the synthesis of two forms of the 7β-t-butoxycarbonylamino-3-chloromethyl-3-cephem-4-carboxylates using ultrasonic irradiation. By SiO2 as weak Lewis acid catalyst, 4-methoxybenzyl 7β-t-butoxycarbonylamino-3-chloromethyl-3-cephem-carboxylate (Boc-ACLE and benzhydryl 7β-t-butoxycarbonylamino-3-chloromethyl-3-cephem-4-carboxylate (Boc-ACLH were successfully synthesized through the efficient protection of the N-t-butoxycarbonyl (N-Boc, and the reactions occurred at low temperature requiring short reaction times and exhibiting excellent isolated yields (96% and 96.2%, resp.. The advantages of this reaction route including the usage of economical reagents and mild reaction conditions and high isolated yield make the two significant t-butoxycarbonylamino cephalosporin intermediates possible in large-scale production.

  20. Roughening instability and ion-induced viscous relaxation of SiO2 surfaces

    International Nuclear Information System (INIS)

    Mayer, T.M.; Chason, E.; Howard, A.J.

    1994-01-01

    We characterize the development of nanometer scale topography (roughness) on SiO 2 surfaces as a result of low energy, off-normal ion bombardment, using in situ energy dispersive x-ray reflectivity and atomic force microscopy. Surfaces roughen during sputtering by heavy ions (Xe), with roughness increasing approximately linearly with ion fluence up to 10 17 cm -2 . A highly coherent ripple structure with wavelength of 30 nm and oriented with the wave vector parallel to the direction of incidence is observed after Xe sputtering at 1 keV. Lower frequency, random texture is also observed. Subsequent light ion (H, He) bombardment smoothens preroughened surfaces. The smoothing kinetics are first order with ion fluence and strongly dependent on ion energy in the range 0.2--1 eV. We present a linear model to account for the experimental observations which includes roughening both by random stochastic processes and by development of a periodic surface instability due to sputter yield variations with surface curvature which leads to ripple development. Smoothing occurs via ion bombardment induced viscous flow and surface diffusion. From the smoothing kinetics with H and He irradiation we measure the radiation enhanced viscosity of SiO 2 and find values on the order of 1--20x10 12 N s m -2 . The viscous relaxation per ion scales as the square root of the ion induced displacements in the film over the range of the ion penetration, suggesting short-lived defects with a bimolecular annihilation mechanism. The surface instability mechanism accounts for the ripple formation, while inclusion of stochastic roughening produces the random texture and reproduces the observed linear roughening kinetics and the magnitude of the overall roughness

  1. In-situ grown CNTs modified SiO2/C composites as anode with improved cycling stability and rate capability for lithium storage

    Science.gov (United States)

    Wang, Siqi; Zhao, Naiqin; Shi, Chunsheng; Liu, Enzuo; He, Chunnian; He, Fang; Ma, Liying

    2018-03-01

    Silica (SiO2) is regarded as one of the most promising anode materials for lithium ion batteries owing to its high theoretical specific capacity, relatively low operation potentials, abundance, environmental benignity and low cost. However, the low intrinsic electrical conductivity and large volume change of SiO2 during the discharge/charge cycles usually results in poor electrochemical performance. In this work, carbon nanotubes (CNTs) modified SiO2/C composites have been fabricated through an in-situ chemical vapor deposition method. The results show that the electrical conductivity of the SiO2/C/CNTs is visibly enhanced through a robust connection between the CNTs and SiO2/C particles. Compared with the pristine SiO2 and SiO2/C composites, the SiO2/C/CNTs composites display a high initial capacity of 1267.2 mA h g-1. Besides, an excellent cycling stability with the capacity of 315.7 mA h g-1 is achieved after 1000th cycles at a rate of 1 A g-1. The significantly improved electrochemical properties of the SiO2/C/CNTs composites are mainly attributed to the formation of three dimensional CNT networks in the SiO2/C substrate, which can not only shorten the Li-ion diffusion path but also relieve the volume change during the lithium-ion insertion/extraction processes.

  2. Digital power and performance analysis of inkjet printed ring oscillators based on electrolyte-gated oxide electronics

    Science.gov (United States)

    Cadilha Marques, Gabriel; Garlapati, Suresh Kumar; Dehm, Simone; Dasgupta, Subho; Hahn, Horst; Tahoori, Mehdi; Aghassi-Hagmann, Jasmin

    2017-09-01

    Printed electronic components offer certain technological advantages over their silicon based counterparts, like mechanical flexibility, low process temperatures, maskless and additive manufacturing possibilities. However, to be compatible to the fields of smart sensors, Internet of Things, and wearables, it is essential that devices operate at small supply voltages. In printed electronics, mostly silicon dioxide or organic dielectrics with low dielectric constants have been used as gate isolators, which in turn have resulted in high power transistors operable only at tens of volts. Here, we present inkjet printed circuits which are able to operate at supply voltages as low as ≤2 V. Our transistor technology is based on lithographically patterned drive electrodes, the dimensions of which are carefully kept well within the printing resolutions; the oxide semiconductor, the electrolytic insulator and the top-gate electrodes have been inkjet printed. Our inverters show a gain of ˜4 and 2.3 ms propagation delay time at 1 V supply voltage. Subsequently built 3-stage ring oscillators start to oscillate at a supply voltage of only 0.6 V with a frequency of ˜255 Hz and can reach frequencies up to ˜350 Hz at 2 V supply voltage. Furthermore, we have introduced a systematic methodology for characterizing ring oscillators in the printed electronics domain, which has been largely missing. Benefiting from this procedure, we are now able to predict the switching capacitance and driver capability at each stage, as well as the power consumption of our inkjet printed ring oscillators. These achievements will be essential for analyzing the performance and power characteristics of future inkjet printed digital circuits.

  3. Compositional dependence of bioactivity of glasses in the system Na2O-K2O-MgO-CaO-B2O3-P2O5-SiO2.

    Science.gov (United States)

    Brink, M; Turunen, T; Happonen, R P; Yli-Urpo, A

    1997-10-01

    The bioactivity, i.e., bone-bonding ability, of 26 glasses in the system Na2O-K2O-MgO-CaO-B2O3-P2O5-SiO2 was studied in vivo. This investigation of bioactivity was performed to establish the compositional dependence of bioactivity, and enabled a model to be developed that describes the relation between reactions in vivo and glass composition. Reactions in vivo were investigated by inserting glass implants into rabbit tibia for 8 weeks. The glasses and the surrounding tissue were examined using scanning electron microscopy (SEM), light microscopy, and energy-dispersive X-ray analysis (EDXA). For most of the glasses containing SiO2, SEM and EDXA showed two distinct layers at the glass surface after implantation, one silica-rich and another containing calcium phosphate. The build-up of these layers in vivo was taken as a sign of bioactivity. The in vivo experiments showed that glasses in the investigated system are bioactive when they contain 14-30 mol % alkali oxides, 14-30 mol % alkaline earth oxides, and SiO2. Glasses containing potassium and magnesium bonded to bone in a similar way as bioactive glasses developed so far.

  4. High-Gain Graphene Transistors with a Thin AlOx Top-Gate Oxide.

    Science.gov (United States)

    Guerriero, Erica; Pedrinazzi, Paolo; Mansouri, Aida; Habibpour, Omid; Winters, Michael; Rorsman, Niklas; Behnam, Ashkan; Carrion, Enrique A; Pesquera, Amaia; Centeno, Alba; Zurutuza, Amaia; Pop, Eric; Zirath, Herbert; Sordan, Roman

    2017-05-25

    The high-frequency performance of transistors is usually assessed by speed and gain figures of merit, such as the maximum oscillation frequency f max , cutoff frequency f T , ratio f max /f T , forward transmission coefficient S 21 , and open-circuit voltage gain A v . All these figures of merit must be as large as possible for transistors to be useful in practical electronics applications. Here we demonstrate high-performance graphene field-effect transistors (GFETs) with a thin AlOx gate dielectric which outperform previous state-of-the-art GFETs: we obtained f max /f T  > 3, A v  > 30 dB, and S 21  = 12.5 dB (at 10 MHz and depending on the transistor geometry) from S-parameter measurements. A dc characterization of GFETs in ambient conditions reveals good current saturation and relatively large transconductance ~600 S/m. The realized GFETs offer the prospect of using graphene in a much wider range of electronic applications which require substantial gain.

  5. Fiber-optic thermometry using thermal radiation from Tm end doped SiO2 fiber sensor.

    Science.gov (United States)

    Morita, Kentaro; Katsumata, Toru; Komuro, Shuji; Aizawa, Hiroaki

    2014-04-01

    Fiber-optic thermometry based on temperature dependence of thermal radiation from Tm(3+) ions was studied using Tm end doped SiO2 fiber sensor. Visible light radiation peaks due to f-f transition of Tm(3+) ion were clearly observed at λ = 690 and 790 nm from Tm end doped SiO2 fibers sensor at the temperature above 600 °C. Thermal radiation peaks are assigned with f-f transition of Tm(3+) ion, (1)D2-(3)H6, and (1)G4-(3)H6. Peak intensity of thermal radiation from Tm(3+) ion increases with temperature. Intensity ratio of thermal radiation peaks at λ = 690 nm against that at λ = 790 nm, I790/690, is suitable for the temperature measurement above 750 °C. Two-dimensional temperature distribution in a flame is successfully evaluated by Tm end doped SiO2 fiber sensor.

  6. Immobilization of simulated reducing agent at the surface of SiO2 fillers in dental composite resins.

    Science.gov (United States)

    Shibata, Satoki; Hirata, Isao; Nomura, Yuji; Shirai, Kenichi; Fujitani, Morioki; Shintani, Hideaki; Okazaki, Masayuki

    2007-07-01

    To reduce the leachability of reducing agents from composite resins, immobilization of a simulated reducing agent at the surface of SiO2 fillers was examined. SiO2 plates were immersed in 2% 3-aminopropyltriethoxy silane/ethanol solution, and then immersed in dimethyl sulfoxide with 0.25 wt% 4-dimethyl amino benzoic acid (DMABA), 2.0 wt% 1-ethyl-3-(3-dimethylaminopropyl) carbodiimide hydrochloride, and 0.5 wt% N-hydroxysuccinimide. Wide-scan spectrum of X-ray photoelectron spectroscopy did not detect carbon contamination. However, narrow scan detected an O=C-N peak at 399.8 eV, suggesting that DMABA could be immobilized on silane-coupled SiO2 plates. Further, surface plasmon resonance analysis indicated the adsorption of MMA at the surface of reducing agent-immobilized plate.

  7. Site-specific Pt deposition and etching on electrically and thermally isolated SiO2 micro-disk surfaces

    International Nuclear Information System (INIS)

    Saraf, Laxmikant V

    2010-01-01

    Electrically and thermally isolated surfaces are crucial for improving the detection sensitivity of microelectronic sensors. The site-specific in situ growth of Pt nano-rods on thermally and electrically isolated SiO 2 micro-disks using wet chemical etching and a focused ion/electron dual beam (FIB-SEM) is demonstrated. Fabrication of an array of micro-cavities on top of a micro-disk is also demonstrated. The FIB source is utilized to fabricate through-holes in the micro-disks. Due to the amorphous nature of SiO 2 micro-disks, the Ga implantation possibly modifies through-hole sidewall surface chemistry rather than affecting its transport properties. Some sensor design concepts based on micro-fabrication of SiO 2 micro-disks utilizing thermally and electrically isolated surfaces are discussed from the viewpoint of applications in photonics and bio-sensing.

  8. Silver nanoparticle deposition on inverse opal SiO2 films embedded in protective polypropylene micropits for SERS applications

    Science.gov (United States)

    Ammosova, Lena; Ankudze, Bright; Philip, Anish; Jiang, Yu; Pakkanen, Tuula T.; Pakkanen, Tapani A.

    2018-01-01

    Common methods to fabricate surface enhanced Raman scattering (SERS) substrates with controlled micro-nanohierarchy are often complex and expensive. In this study, we demonstrate a simple and cost effective method to fabricate SERS substrates with complex geometries. Microworking robot structuration is used to pattern a polypropylene (PP) substrate with micropits, facilitating protective microenvironment for brittle SiO2 inverse opal (IO) structure. Hierarchical SiO2 IO patterns were obtained using polystyrene (PS) spheres as a sacrificial template, and were selectively embedded into the hydrophilized PP micropits. The same microworking robot technique was subsequently used to deposit silver nanoparticle ink into the SiO2 IO cavities. The fabricated multi-level micro-nanohierarchy surface was studied to enhance Raman scattering of the 4-aminothiophenol (4-ATP) analyte molecule. The results show that the SERS performance of the micro-nanohierarchical substrate increases significantly the Raman scattering intensity compared to substrates with structured 2D surface geometries.

  9. Synthesis of suitable SiO2 nano particles as the core in core-shell nanostructured materials.

    Science.gov (United States)

    Ghahari, Mehdi; Aghababazadeh, Roya; Ebadzadeh, Touradj; Mirhabibi, Alireza; Brydson, Rik; Fabbri, Paola; Najafi, Farhod

    2011-06-01

    The effect of surfactant on the luminescent intensity of SiO2 @Y2O3:Eu3+ particles with a core shell structure is described. Core-shell particles are used in phosphor materials and employing spherical particles with a narrow size distribution is vital for the enhancement of luminescent properties. Three kinds of different surfactants were used to synthesis SiO2 nano particles via a sol gel process. The results demonstrated that comb polycarboxylic acid surfactant had a significant influence on the morphology and particle size distribution. Somehow, particles with 100 nm size and narrow size distribution were produced. These particles had relatively uniform packing, unlike particles produced with other surfactants or without surfactant which had irregular assembly. The photoluminescence intensity of SiO2 @Y2O3:Eu3+ particles that was synthesized by comb polycarboxylic acid surfactant was higher than those which were produced without surfactant.

  10. Oxidation of Phe454 in the Gating Segment Inactivates Trametes multicolor Pyranose Oxidase during Substrate Turnover

    Czech Academy of Sciences Publication Activity Database

    Halada, Petr; Brugger, D.; Volc, Jindřich; Peterbauer, C.K.; Leitner, C.; Haltrich, D.

    2016-01-01

    Roč. 11, č. 2 (2016), e0148108 E-ISSN 1932-6203 R&D Projects: GA MŠk(CZ) LO1509; GA MŠk MEB060910 Institutional support: RVO:61388971 Keywords : AMINO-ACID-RESIDUES * PROTEIN PHARMACEUTICALS * ENZYMATIC OXIDATION Subject RIV: EE - Microbiology, Virology Impact factor: 2.806, year: 2016

  11. Monodisperse and core-shell-structured SiO2@YBO3:Eu3+ spherical particles: synthesis and characterization.

    Science.gov (United States)

    Lin, Cuikun; Kong, Deyan; Liu, Xiaoming; Wang, Huan; Yu, Min; Lin, Jun

    2007-04-02

    Y0.9Eu0.1BO3 phosphor layers were deposited on monodisperse SiO2 particles of different sizes (300, 570, 900, and 1200 nm) via a sol-gel process, resulting in the formation of core-shell-structured SiO2@Y0.9Eu0.1BO3 particles. X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), transmission electron microscopy (TEM), photoluminescence (PL), and cathodoluminescence (CL) spectra as well as lifetimes were employed to characterize the resulting composite particles. The results of XRD, FE-SEM, and TEM indicate that the 800 degrees C annealed sample consists of crystalline YBO3 shells and amorphous SiO2 cores, in spherical shape with a narrow size distribution. Under UV (240 nm) and VUV (172 nm) light or electron beam (1-6 kV) excitation, these particles show the characteristic 5D0-7F1-4 orange-red emission lines of Eu3+ with a quantum yield ranging from 36% (one-layer Y0.9Eu0.1BO3 on SiO2) to 54% (four-layer Y0.9Eu0.1BO3 on SiO2). The luminescence properties (emission intensity and color coordinates) of Eu3+ ions in the core-shell particles can be tuned by the coating number of Y0.9Eu0.1BO3 layers and SiO2 core particle size to some extent, pointing out the great potential for these particles applied in displaying and lightening fields.

  12. Biotemplated Mesoporous TiO2/SiO2 Composite Derived from Aquatic Plant Leaves for Efficient Dye Degradation

    Directory of Open Access Journals (Sweden)

    Zhiying Yan

    2017-03-01

    Full Text Available The biotemplating technique is an environmental-protective high-efficiency new technology by which the resulting TiO2 may simultaneously attain the duplication of structure and self-doping elements from biotemplate materials, which is highly desirable for photocatalytic applications. In this paper, aquatic plant leaves—including reed, water hyacinth, and duckweed—were used as both templates and silicon precursors to successfully synthesize biomorphic TiO2/SiO2 composite with mesoporous structures. X-ray diffraction, scanning electron microscopy, transmission electron microscopy, N2 adsorption–desorption, and UV–visible diffuse reflectance spectra were applied to characterize the microstructures of the samples. The results show that all TiO2/SiO2 composites are mainly composed of an anatase phase with mesoporous structure and possess high specific surface area. Compared with commercial Degussa P25 TiO2, all TiO2/SiO2 samples display intensive light-harvesting efficiency, particularly in the visible light range. The activities were evaluated by using gentian violet as a target for photocatalytic degradation experiments under simulated solar irradiation. The TiO2/SiO2 samples templated by reed and water hyacinth leaves exhibit high activity, while the TiO2/SiO2 samples obtained from duckweed are inferior to P25 in the degradation of gentian violet. A synergistic effect of SiO2 incorporation and structural construction through biotemplating is proposed to be beneficial to photocatalytic activity.

  13. Effect of SiO2 concentration in silica sol on interface reaction during titanium alloy investment casting

    Directory of Open Access Journals (Sweden)

    Ya-meng Wei

    2018-01-01

    Full Text Available Using silica sol as a binder for titanium investment casting is very attractive due to its good stability and reasonable cost as compared with yttrium sol and zirconium sol. However, the mechanism of interface reaction in the related system remains unclear. In this investigation, the interface reaction between Y2O3-SiO2 (Y-Si shell mold and titanium alloys was studied. A group of shell molds were prepared by using Y2O3 sand and silica sol with different contents of SiO2. Ti-6Al-4V alloy was cast under vacuum by gravity casting through cold crucible induction melting (CCIM method. Scanning electron microscopy (SEM and energy dispersive x-ray spectroscopy (EDS were employed to characterize the micromorphology and composition of the reaction area, respectively. X-ray photoelectron spectroscopy (XPS was used to confirm the valence state of relevant elements. White light interferometer (WLI was used to obtain the surface topography of Y-Si shells. The results show that the thickness of reaction layers is below 3 μm when the SiO2 content of silica sol is below 20wt.%. Whereas, when the SiO2 content increases to 25wt.%, the thickness of the reaction layer increases sharply to about 15 μm. There is a good balance between chemical inertness and mechanical performance when the SiO2 content is between 15 and 20wt.%. Moreover, it was found that the distribution of SiO2 and the roughness at the surface of the shell are the key factors that determine the level of reaction.

  14. Core-Shell MnO2-SiO2 Nanorods for Catalyzing the Removal of Dyes from Water

    Directory of Open Access Journals (Sweden)

    Wei Gong

    2017-01-01

    Full Text Available This work presented a novel core-shell MnO2@m-SiO2 for catalyzing the removal of dyes from wastewater. MnO2 nanorods were sequentially coated with polydopamine (PDA and polyethyleneimine (PEI forming MnO2@PDA-PEI. By taking advantage of the positively charged amine groups, MnO2@PDA-PEI was further silicificated, forming MnO2@PDA-PEI-SiO2. After calcination, the composite MnO2@m-SiO2 was finally obtained. MnO2 nanorod is the core and mesoporous SiO2 (m-SiO2 is the shell. MnO2@m-SiO2 has been used to degrade a model dye Rhodamine B (RhB. The shell m-SiO2 functioned to adsorb/enrich and transfer RhB, and the core MnO2 nanorods oxidized RhB. Thus, MnO2@m-SiO2 combines multiple functions together. Experimental results demonstrated that MnO2@m-SiO2 exhibited a much higher efficiency for degradation of RhB than MnO2. The RhB decoloration and degradation efficiencies were 98.7% and 84.9%, respectively. Consecutive use of MnO2@m-SiO2 has demonstrated that MnO2@m-SiO2 can be used to catalyze multiple cycles of RhB degradation. After six cycles of reuse of MnO2@m-SiO2, the RhB decoloration and degradation efficiencies were 98.2% and 71.1%, respectively.

  15. Investigation of interface property in Al/SiO2/ n-SiC structure with thin gate oxide by illumination

    Science.gov (United States)

    Chang, P. K.; Hwu, J. G.

    2017-04-01

    The reverse tunneling current of Al/SiO2/ n-SiC structure employing thin gate oxide is introduced to examine the interface property by illumination. The gate current at negative bias decreases under blue LED illumination, yet increases under UV lamp illumination. Light-induced electrons captured by interface states may be emitted after the light sources are off, leading to the recovery of gate currents. Based on transient characteristics of gate current, the extracted trap level is close to the light energy for blue LED, indicating that electron capture induced by lighting may result in the reduction of gate current. Furthermore, bidirectional C- V measurements exhibit a positive voltage shift caused by electron trapping under blue LED illumination, while a negative voltage shift is observed under UV lamp illumination. Distinct trapping and detrapping behaviors can be observed from variations in I- V and C- V curves utilizing different light sources for 4H-SiC MOS capacitors with thin insulators.

  16. Photo-induced tunneling currents in MOS structures with various HfO2/SiO2 stacking dielectrics

    OpenAIRE

    Chin-Sheng Pang; Jenn-Gwo Hwu

    2014-01-01

    In this study, the current conduction mechanisms of structures with tandem high-k dielectric in illumination are discussed. Samples of Al/SiO2/Si (S), Al/HfO2/SiO2/Si (H), and Al/3HfO2/SiO2/Si (3H) were examined. The significant observation of electron traps of sample H compares to sample S is found under the double bias capacitance-voltage (C-V) measurements in illumination. Moreover, the photo absorption sensitivity of sample H is higher than S due to the formation of HfO2 dielectric layer,...

  17. Facile Synthesis and Growth Mechanism of SiO2 Nanotubes with ZnS Nanowires as Intermediates.

    Science.gov (United States)

    Chuo, Hui Xin; Wu, Li Li

    2016-04-01

    SiO2 nanotubes with good chemical purity and well defined morphology were synthesized successfully in a one-step gas phase condensation process using gold catalyst. The as-synthesized products were characterized by transmission electron microscopy and nanoprobe X-ray energy dispersive. In the observations, a growth mechanism of the nanotubes is suggested. The new synthetic route to prepare SiO2 nanotubes is favorable to satisfy the special needs in commercial and industrial application and can be easily applied to other semiconductor materials.

  18. Liquidus Temperature of SrO-Al2O3-SiO2 Glass-Forming Compositions

    DEFF Research Database (Denmark)

    Abel, Brett M.; Morgan, James M.; Mauro, John C.

    2013-01-01

    Despite the important role of strontium aluminosilicate glasses in various technologies, there is no available phase diagram for this ternary system in the ACerS-NIST Phase Equilibria Diagrams Database. Establishing the liquidus surface (liquidus temperature Tliq and primary devitrification phase...... with the phase diagrams for CaO-Al2O3-SiO2 and MgO-Al2O3-SiO2 systems, we have found that for the highest [RO]/[Al2O3] ratios, Tliq exhibits a minimum value for R = Ca. Based on the phase diagram established here, the composition of glass materials, for example, for liquid crystal display substrates, belonging...

  19. SiO2/TiO2 multi-layered thin films with self-cleaning and enhanced ...

    Indian Academy of Sciences (India)

    using a TEOS:EtOH:HCl:H2O in 1:8:3:0.5 volume ratio. The as-prepared SiO2 gel was then calcinated at 600 ... 0.25 g SiO2 powder in 50 ml ethanol:water (1:1 v/v), respec- tively, 0.05 g TiO2 powder in 50 ml ethanol. ... cleaned by ultra-sonication in alcohol and then dried using compressed air. The multi-layered thin films ...

  20. Direct etching of SiO2 and Al2O3 by 900-keV gold ions

    OpenAIRE

    Glass, Gary A.; Dias, Johnny Ferraz; Dymnikov, Alexander D.; Houston, Louis M.; Rout, Bibhudutta

    2009-01-01

    We report the direct etching of Al2O3 and SiO2 using 900-keV Au+ ions. 2000-mesh Cu grids were employed as masks using two different configurations: 1 the Cu mesh was placed on top of each insulator separately and independent irradiations were performed, and 2 the Al2O3 and SiO2 substrates were positioned in an edge-to-edge configuration with a single Cu grid providing a common mask to both insulators. Scanning electron microscopy SEM analysis revealed quite different patterns resulting from ...

  1. Gallium arsenide (GaAs) island growth under SiO(2) nanodisks patterned on GaAs substrates.

    Science.gov (United States)

    Tjahjana, Liliana; Wang, Benzhong; Tanoto, Hendrix; Chua, Soo-Jin; Yoon, Soon Fatt

    2010-05-14

    We report a growth phenomenon where uniform gallium arsenide (GaAs) islands were found to grow underneath an ordered array of SiO(2) nanodisks on a GaAs(100) substrate. Each island eventually grows into a pyramidal shape resulting in the toppling of the supported SiO(2) nanodisk. This phenomenon occurred consistently for each nanodisk across a large patterned area of approximately 50 x 50 microm(2) (with nanodisks of 210 nm diameter and 280 nm spacing). The growth mechanism is attributed to a combination of 'catalytic' growth and facet formation.

  2. Facile preparation of polyethylenimine-tannins coated SiO2 hybrid materials for Cu2+ removal

    Science.gov (United States)

    Huang, Qiang; Liu, Meiying; Zhao, Jiao; Chen, Junyu; Zeng, Guangjian; Huang, Hongye; Tian, Jianwen; Wen, Yuanqing; Zhang, Xiaoyong; Wei, Yen

    2018-01-01

    Polyethylenimine-tannins coated SiO2 (SiO2@PEI-TA) hybrid materials have been prepared via a single-step multifunctional coating with polyethylenimine (PEI) and tannins (TA), and characterized by transmission electron microscope (TEM), Fourier transform infrared spectroscopy (FT-IR), thermogravimetric analysis (TGA), and X-ray photoelectron spectroscopy (XPS). The as-prepared SiO2@PEI-TA composites were examined as adsorbents to remove the Cu2+ from aqueous solution. The effects of contact time, initial Cu2+ concentration, solution pH and temperature, on Cu2+ adsorption have been investigated. The results show that the adsorption of Cu2+ onto SiO2@PEI-TA is dependent on the contact time, Cu2+ concentration, pH and temperature. The SiO2@PEI-TA composites show a 2.4-fold increase in adsorption capacity, implying that the introduction of PEI-TA coating is in favor of the Cu2+ adsorption. Based on the analysis of kinetic data, the kinetics of Cu2+ adsorption is more accurately described by the pseudo-second-order model. The equilibrium data are analyzed by Langmuir and Freundlich isotherms. Results of isotherms show that the better agreement is Freundlich isotherm model with correlation coefficient of 0.9914, which suggests that the adsorption of Cu2+ onto SiO2@PEI-TA is mainly a heterogeneous adsorption process. Thermodynamic analyses show that the adsorption interaction is actually a spontaneous and endothermic chemical process, which might involve the chemical chelation between Cu2+ and functional groups (amine and carboxyl groups) on the surface of SiO2@PEI-TA. In addition, the Cu2+ ions could desorb from SiO2@PEI-TA by using acid solution and the adsorption efficiency remains at high level after five adsorption-desorption recycles. These results provide potential applications of these novel adsorbents for the removal of heavy metal Cu2+ from aqueous solution and also provide strong evidence to support the adsorption mechanism proposed in the study.

  3. Investigation of Electrical and Optical Characteristics of Nanohybride Composite (Polyvinyl Alcohol / Nickel Oxide

    Directory of Open Access Journals (Sweden)

    A. Hayati

    2014-01-01

    Full Text Available Some issues; leakage, tunneling currents, boron diffusion are threatening SiO2 to be used as a good gate dielectric for the future of the CMOS (complementary metal- oxide- semiconductor transistors. For finding an alternative and novel gate dielectric, the NiO (Nickel oxide and PVA (polyvinyl alcohol nano powders were synthesized with the sol-gel method and their nano structural properties were studied using the X-ray diffraction (XRD, Atomic force microscopy (AFM, Scanning electron microscopy (SEM, UV-Vis spectrophotometer and GPS 132 techniques. The obtained results indicated that the sample (5 g NiO and 0.02g PVA prepared at 30˚C, annealed in an oven at a temperature of 80˚C can fill this gap due to its higher dielectric constant, better morphology, less rough surface and less leakage current.

  4. Comparative study of CNT, silicon nanowire and fullerene embedded multilayer high-k gate dielectric MOS memory devices

    Science.gov (United States)

    Sengupta, Amretashis; Sarkar, Chandan Kumar; Requejo, Felix G.

    2011-10-01

    Here, we present a comparative theoretical study on stacked (multilayer) gate dielectric MOS memory devices, having a metallic/semiconducting carbon nanotube (CNT), silicon nanowire (Si NW) and fullerene (C60) embedded nitride layer acting as a floating gate. Two types of devices, one with HfO2-SiO2 stack (stack-1) and the other with La2O3-SiO2 stack (stack-2) as the tunnel oxide were compared. We evaluated the effective barrier height, the dielectric constant and the effective electron mobility in the composite gate dielectric with the Maxwell-Garnett effective medium theory. Thereafter applying the WKB approximation, we simulated the Fowler-Nordheim (F-N) tunnelling/writing current and the direct tunnelling/leakage current in these devices. We evaluated the I-V characteristics, the charge decay and also the impact of CNT/Si NW aspect ratio and the volume fraction on the effective barrier height and the write voltage, respectively. We also simulated the write time, retention time and the erase time of these MOS devices. Based on the simulation results, it was concluded that the metallic CNT embedded stack-1 device offered the best performance in terms of higher F-N tunnelling current, lower direct tunnelling current and lesser write voltage and write time compared with the other devices. In case of direct tunnelling leakage and retention time it was found that the met CNT embedded stack-2 device showed better characteristics. For erasing, however, the C60 embedded stack-1 device showed the smallest erase time. When compared with earlier reports, it was seen that CNT, C60 and Si NW embedded devices all performed better than nanocrystalline Si embedded MOS non-volatile memories.

  5. Chemical Gated Field Effect Transistor by Hybrid Integration of One-Dimensional Silicon Nanowire and Two-Dimensional Tin Oxide Thin Film for Low Power Gas Sensor.

    Science.gov (United States)

    Han, Jin-Woo; Rim, Taiuk; Baek, Chang-Ki; Meyyappan, M

    2015-09-30

    Gas sensors based on metal-oxide-semiconductor transistor with the polysilicon gate replaced by a gas sensitive thin film have been around for over 50 years. These are not suitable for the emerging mobile and wearable sensor platforms due to operating voltages and powers far exceeding the supply capability of batteries. Here we present a novel approach to decouple the chemically sensitive region from the conducting channel for reducing the drive voltage and increasing reliability. This chemically gated field effect transistor uses silicon nanowire for the current conduction channel with a tin oxide film on top of the nanowire serving as the gas sensitive medium. The potential change induced by the molecular adsorption and desorption allows the electrically floating tin oxide film to gate the silicon channel. As the device is designed to be normally off, the power is consumed only during the gas sensing event. This feature is attractive for the battery operated sensor and wearable electronics. In addition, the decoupling of the chemical reaction and the current conduction regions allows the gas sensitive material to be free from electrical stress, thus increasing reliability. The device shows excellent gas sensitivity to the tested analytes relative to conventional metal oxide transistors and resistive sensors.

  6. Impact of oxidation and reduction annealing on the electrical properties of Ge/La2O3/ZrO2gate stacks.

    Science.gov (United States)

    Henkel, Christoph; Hellström, Per-Erik; Ostling, Mikael; Stöger-Pollach, Michael; Bethge, Ole; Bertagnolli, Emmerich

    2012-08-01

    The paper addresses the passivation of Germanium surfaces by using layered La 2 O 3 /ZrO 2 high- k dielectrics deposited by Atomic Layer Deposition to be applied in Ge-based MOSFET devices. Improved electrical properties of these multilayered gate stacks exposed to oxidizing and reducing ambient during thermal post treatment in presence of thin Pt cap layers are demonstrated. The results suggest the formation of thin intermixed La x Ge y O z interfacial layers with thicknesses controllable by oxidation time. This formation is further investigated by XPS, EDX/EELS and TEM analysis. An additional reduction annealing treatment further improves the electrical properties of the gate dielectrics in contact with the Ge substrate. As a result low interface trap densities on (1 0 0) Ge down to 3 × 10 11  eV -1  cm -2 are demonstrated. The formation of the high- k La x Ge y O z layer is in agreement with the oxide densification theory and may explain the improved interface trap densities. The scaling potential of the respective layered gate dielectrics used in Ge-based MOS-based device structures to EOT of 1.2 nm or below is discussed. A trade-off between improved interface trap density and a lowered equivalent oxide thickness is found.

  7. THE THERMODYNAMIC PROPERTIES OF MELTS OF DOUBLE SYSTEM MgO – Al2O3, MgO – SiO2, MgO – CaF2, Al2O3 – SiO2, Al2O3 – CaF2, SiO2 – CaF2

    Directory of Open Access Journals (Sweden)

    В. Судавцова

    2012-04-01

    Full Text Available Methodology of prognostication of thermodynamics properties of melts is presented from the coordinatesof liquidus of diagram of the state in area of equilibria a hard component is solution, on which energies ofmixing of Gibbs are expected in the double border systems of MgO – Al2O3, MgO – SiO2, MgO – CaF2,Al2O3 – SiO2, Al2O3 - CaF2, SiO2 - CaF2. For the areas of equilibrium there is quasibinary connection(MgAl2O4, Mg2SiO4, Al6Si2O13 – a grout at calculations was used equalization of Hauffe-Wagner. Theobtained data comport with literary

  8. Partial redetermination of the phase diagram of the system Al2O3 - ZrO2 - SiO2

    International Nuclear Information System (INIS)

    Greca, M.C.; Emiliano, J.V.; Segadaes, A.M.

    1990-01-01

    Current research on the mechanical behaviour of ceramic matrices reinforced by zirconia particles, and on the processing of mullite-zirconia via reaction-sintering, has brought about the need to update the phase diagram of the system Al 2 O 3 -ZrO 2 -SiO 2 , whose available version dates back to 1956. In the present work, selected compositions in this system were prepared from reagent-grade oxides, uniaxially pressed into 6 mm cylindrical pellets, fired at temperatures between 1550 and 1750 0 C for 6 to 24 h, water-quenched, and observed by X-ray diffraction and SEM, the composition of some of the phases identified being evaluated by EPMA. The data so obtained led to the relocation of the boundary curves neighbouring the ternary eutectic involving alumina, zirconia and mullite. This eutectic was found to occur at ∼ 1750 0 C, a temperature significantly lower than previously reported. (author) [pt

  9. Luminescent properties and characterization of Gd2O3:Eu3+@SiO2 and Gd2Ti2O7:Eu3+@SiO2 core shell phosphors prepared by a sol gel process

    Science.gov (United States)

    Lin, Kuo-Min; Lin, Chih-Cheng; Li, Yuan-Yao

    2006-03-01

    Gd2O3:Eu3+ and Gd2Ti2O7:Eu3+ films 10 nm in thickness were individually coated onto silica spheres (particle size of 150-170 nm) using the sol-gel method. The synthesized materials were addressed as Gd2O3:Eu3+@SiO2 and Gd2Ti2O7:Eu3+@SiO2 phosphors. An x-ray powder diffractometer (XRD), field emission scanning electron microscope (FE-SEM), high-resolution transmission electron microscope (HR-TEM), and photoluminescence spectrophotometer (PL) were employed to characterize the core-shell phosphors. Uniform core-shell phosphor particles were observed using FE-SEM. The XRD and HR-TEM results indicated that the coated-shell layer was well crystallized after sintering at 1000 °C. The Gd2O3:Eu3+@SiO2 PL measurement showed a red emission at the main 615 nm wavelength. The Gd2Ti2O7:Eu3+@SiO2 phosphor showed an orange-red emission at the 588 and 615 nm wavelengths. In comparison with the Gd2O3:Eu3+ and Gd2Ti2O7:Eu3+ bulk material results, the core-shell phosphors maintained the same emission ability as the bulk materials and the novel core-shell phosphors possessed great potential in quantum phosphor applications.

  10. Luminescent properties and characterization of Gd2O3:Eu(3+)@SiO2 and Gd2Ti2O7:Eu(3+)@SiO2 core-shell phosphors prepared by a sol-gel process.

    Science.gov (United States)

    Lin, Kuo-Min; Lin, Chih-Cheng; Li, Yuan-Yao

    2006-03-28

    Gd2O3:Eu(3+) and Gd2Ti2O7:Eu(3+) films 10 nm in thickness were individually coated onto silica spheres (particle size of 150-170 nm) using the sol-gel method. The synthesized materials were addressed as Gd2O3:Eu(3+)@SiO2 and Gd2Ti2O7:Eu(3+)@SiO2 phosphors. An x-ray powder diffractometer (XRD), field emission scanning electron microscope (FE-SEM), high-resolution transmission electron microscope (HR-TEM), and photoluminescence spectrophotometer (PL) were employed to characterize the core-shell phosphors. Uniform core-shell phosphor particles were observed using FE-SEM. The XRD and HR-TEM results indicated that the coated-shell layer was well crystallized after sintering at 1000 °C. The Gd2O3:Eu(3+)@SiO2 PL measurement showed a red emission at the main 615 nm wavelength. The Gd2Ti2O7:Eu(3+)@SiO2 phosphor showed an orange-red emission at the 588 and 615 nm wavelengths. In comparison with the Gd2O3:Eu(3+) and Gd2Ti2O7:Eu(3+) bulk material results, the core-shell phosphors maintained the same emission ability as the bulk materials and the novel core-shell phosphors possessed great potential in quantum phosphor applications.

  11. Electrical and materials properties of ZrO2 gate dielectrics grown by atomic layer chemical vapor deposition

    Science.gov (United States)

    Perkins, Charles M.; Triplett, Baylor B.; McIntyre, Paul C.; Saraswat, Krishna C.; Haukka, Suvi; Tuominen, Marko

    2001-04-01

    Structural and electrical properties of gate stack structures containing ZrO2 dielectrics were investigated. The ZrO2 films were deposited by atomic layer chemical vapor deposition (ALCVD) after different substrate preparations. The structure, composition, and interfacial characteristics of these gate stacks were examined using cross-sectional transmission electron microscopy and x-ray photoelectron spectroscopy. The ZrO2 films were polycrystalline with either a cubic or tetragonal crystal structure. An amorphous interfacial layer with a moderate dielectric constant formed between the ZrO2 layer and the substrate during ALCVD growth on chemical oxide-terminated silicon. Gate stacks with a measured equivalent oxide thickness (EOT) of 1.3 nm showed leakage values of 10-5 A/cm2 at a bias of -1 V from flatband, which is significantly less than that seen with SiO2 dielectrics of similar EOT. A hysteresis of 8-10 mV was seen for ±2 V sweeps while a midgap interface state density (Dit) of ˜3×1011 states/cm eV was determined from comparisons of measured and ideal capacitance curves.

  12. Energy spectroscopy studies of radiation-induced damaged surfaces and interfaces in SiO 2/Si by light charged particles

    Science.gov (United States)

    Zhongquan, Ma; Qi, Guo; Tao, Jin

    1992-09-01

    In this paper, the three different experimental techniques of AES (Auger electron spectroscopy), ARXPS (angle-resolved X-ray photoelectron spectroscopy) and DLTS (deep level transient spectroscopy) with C- V measurements have been applied to study damaged surfaces and interfaces of SiO 2Si in MOS. The defects, appearing at the surface of the dielectric layer and the interface between SiO 2 and Si, induced by energetic electron and/or hydrogen ion (H +) beams, were independently investigated using ARXPS and AES combined with DLTS, respectively. The more intermediate oxidation states, such as Si 1+, Si 2+ and Si 3+, corresponding to Si 2O, SiO and Si 2O 3 clusters formed at the surface and the transition regions, were obtained for the irradiated sample. The changes of the intensity, full width at half maximum (fwhm) and binding energy of each ARXPS spectrum with take-off angle showed that silicon-rich clusters or chains, and about 4.8 Å of an amorphous silicon, actually existed in the outermost surface as a result of preferential sputtering of oxygen by electron ionization and displacement by H +. The Si 2p core-level spectra were analyzed in terms of five chemically shifted components corresponding to the basic Si binding units SiO n with n = 0, 1, ⋯, 4. The concentration of these bonding units as a function of effective depth of emission was essentially in agreement with the random-bonding model. But some separation into a silicon-rich phase was also evident at intermediate stoichiometries and stacks. In addition, more dangling bonds of Si were present overall in the oxide layer, which acted with an amphoteric character and caused the defect states to lie in the lower half of the bandgap.

  13. Fabrication of a solution-gated transistor based on valinomycin modified iron oxide nanoparticles decorated zinc oxide nanorods for potassium detection.

    Science.gov (United States)

    Ahn, Min-Sang; Ahmad, Rafiq; Bhat, Kiesar Sideeq; Yoo, Jin-Young; Mahmoudi, Tahmineh; Hahn, Yoon-Bong

    2018-05-15

    There are considerable interests to detect and monitor the abnormal level of minerals in water for avoiding/preventing any toxic effects after consumption. Herein, we report the fabrication of solution-gated field-effect-transistor (FET) based potassium sensor using iron oxide nanoparticles (Fe 2 O 3 NPs) modified directly grown zinc oxide nanorods (ZnO NRs). The Fe 2 O 3 NPs modification of ZnO NRs provided stability to nanorods surface and improved surface area for valinomycin immobilization. As-fabricated potassium sensor (valinomycin-Fe 2 O 3 NPs-ZnO NRs/SiO 2 /Si) provided enhanced current response with increasing potassium concentration. During sensing measurements, FET sensor showed high sensitivity (4.65 μA/μM/cm 2 ) in the linear range of 0.1 μM to 125 μM, low limit of detection (∼0.04 μM), good stability, excellent reproducibility, and favorable selectivity. Thus, good sensing performance of the FET based potassium sensor presents it as simple, low-cost, and convenient device for selective detection of potassium in solution. Copyright © 2018 Elsevier Inc. All rights reserved.

  14. PENGUJIAN AKTIVITAS KOMPOSIT Fe2O3-SiO2 SEBAGAI FOTOKATALIS PADA FOTODEGRADASI 4-KLOROFENOL (The Activity Test of Fe2O3-SiO2 Composite As Photocatalyst on 4-Chlorophenol Photodegradation

    Directory of Open Access Journals (Sweden)

    Eko Sri Kunarti

    2009-03-01

    Full Text Available ABSTRAK  Pada penelitian ini telah dilakukan pengujian aktivitas komposit Fe2O3-SiO2 sebagai fotokatalis pada fotodegradasi 4-klorofenol. Penelitian diawali dengan preparasi dan karakterisasi fotokatalis Fe2O3-SiO2. Preparasi dilakukan dengan metode sol-gel pada temperatur kamar menggunakan tetraetil ortosilikat (TEOS dan besi (III nitrat sebagai prekursor diikuti dengan perlakuan termal pada temperature 500 oC. Karakterisasi dilakukan dengan metode spektrometri inframerah, difraksi sinar-X dan spektrometri fluoresensi sinar-X. Uji aktivitas komposit untuk fotodegradasi 4-klorofenol dilakukan dalam reaktor tertutup yang dilengkapi dengan lampu UV. Pada uji ini telah dipelajari pengaruh waktu penyinaran dan pH larutan terhadap efektivitas fotodegradasi 4-klorofenol. Hasil penelitian menunjukkan bahwa komposit Fe2O3-SiO2 dapat dipreparasi dengan metode sol-gel pada temperatur kamar diikuti perlakuan termal. Komposit Fe2O3-SiO2 dapat meningkatkan efektivitas fotodegradasi 4-klorofenol dari 11,86 % menjadi 55,38 %. Efektivitas fotodegradasi 4- klorofenol dipengaruhi waktu penyinaran dan pH larutan yang semakin lama waktu penyinaran efektifitas fotodegradasi semakin tinggi, namun waktu penyinaran yang lebih lama dari 4 jam dapat menurunkan efektivitasnya. pH larutan memberikan pengaruh yang berbeda-beda pada efektivitas fotodegradasi 4-klorofenol.   ABSTRACT The activity test of Fe2O3-SiO2 composite as photocatalyst on 4-chlorophenol photodegradation has been studied. The research was initiated by preparation of Fe2O3-SiO2 photocatalyst and followed by characterization. The preparation was conducted by sol-gel method at room temperature using tetraethylorthosilicate (TEOS and iron (III nitrate as precursors followed by thermal treatment at a temperature of 500oC. The characterizations were performed by X-ray Diffraction (XRD, Infrared and X-ray Fluorescence Spectrophotometry. The photocatalytic activity test of composites for 4 chlorophenol degradation was carried out in a closed reactor equipped with UV light. In this test, the influences of irradiation time and 4-chlorophenol pH were studied.  Results showed that the composite could be prepared through sol-gel method. The Fe2O3-SiO2 composite could increase activity of 4-chlorophenol photodegradation from 11.86 % to 55.38 %. The photodegradation effectiveness was influenced by irradiating time and pH of solution. The pH of solution gave different 4-chlorophenol photodegradation effectiveness.

  15. Analytical drain current model for symmetric dual-gate amorphous indium gallium zinc oxide thin-film transistors

    Science.gov (United States)

    Qin, Ting; Liao, Congwei; Huang, Shengxiang; Yu, Tianbao; Deng, Lianwen

    2018-01-01

    An analytical drain current model based on the surface potential is proposed for amorphous indium gallium zinc oxide (a-InGaZnO) thin-film transistors (TFTs) with a synchronized symmetric dual-gate (DG) structure. Solving the electric field, surface potential (φS), and central potential (φ0) of the InGaZnO film using the Poisson equation with the Gaussian method and Lambert function is demonstrated in detail. The compact analytical model of current–voltage behavior, which consists of drift and diffusion components, is investigated by regional integration, and voltage-dependent effective mobility is taken into account. Comparison results demonstrate that the calculation results obtained using the derived models match well with the simulation results obtained using a technology computer-aided design (TCAD) tool. Furthermore, the proposed model is incorporated into SPICE simulations using Verilog-A to verify the feasibility of using DG InGaZnO TFTs for high-performance circuit designs.

  16. Nanocristales de silicio en matriz de SiO2 para aplicaciones fotónicas

    Directory of Open Access Journals (Sweden)

    Morante, J. R.

    2004-04-01

    Full Text Available We describe in this work the development of both materials and technology approaches that have allowed us to successfully produce efficient and reliable LEDs by using only CMOS processes. Si nanocrystals (Si-nc were synthesised in SiO2 by ion implantation plus annealing and display average diameters from 2.5 to 6 nm. Wide photoluminescence around 700-800 (red nm is present in all the samples. The most efficient structures have Si-ncs with average size of 3 nm and densities of 1019 cm-3. We have estimated band-gap energies, lifetimes (20-200 μs and absorption cross-sections (10-15-10-16 cm2 as a function of size and surface passivation. From highly luminescent Si-nc, LEDs consisting of MOS capacitors were fabricated. Stable red electroluminescence has been obtained at room temperature and the I-V characteristics prove that the current is related to a pure tunnelling process.En este trabajo describimos la tecnología y los materiales empleados en la fabricación de nanocristales de silicio (Si-nc para obtener dispositivos luminiscentes usando procesos compatibles con la tecnología CMOS. Los nanocristales de Silicio se sintetizaron a partir de una implantación iónica sobre SiO2 y un posterior recocido, consiguiendo una distribución de tamaños que varia desde 2.5 a 6 nm dependiendo de la dosis de implantación. Todas las muestras presentan una fotoluminiscencia ancha alrededor de 700-800 nm (rojo, que se desplaza fuertemente con el tamaño medio de los nanocristales. Las estructuras más eficientes presentan una tamaño promedio de 3 nm, con una densidad de 1019 cm-3. En cuanto a fotoluminiscencia, se ha hecho una estimación de las energías del gap, de las vidas medias (20-200 μs y las secciones eficaces de absorción (10-15-10-16 cm2 en función del tamaño y de la pasivación de la superficie de los nanocristales. En estructuras tipo MOS con Si-nc se obtuvo electroluminiscencia muy fuerte y estable a temperatura ambiente. Las curvas I-V muestran que la corriente es debida puramente a un mecanismo de efecto túnel.

  17. Physical properties of emulsion systems with SiO2 nanoparticles

    Directory of Open Access Journals (Sweden)

    Sergeev Vitaly Vyacheslavovich

    2017-11-01

    Full Text Available One of the most relevant directions for research and development (R&D in the area of oil and gas fields development is to study physicochemical impact onto petroleum reservoir to enhance development rate and increase oil recovery factor. Wide range of fields where nanoscale particles can be applied within this direction shifted the level of physicochemical processes studies from microscale to nanoscale, that caused significant advancement of the oil and gas industry as a whole. As for physicochemical methods for petroleum reservoir stimulation, the rapid development of nanotechnologies considerably improves understanding of the processes that run at the boundaries of phases liquid-liquid, liquid-gas, liquid-rock phases, etc. The most studied processes are the processes of influence of nanoscale particles on the interface between liquid-gas and liquid-liquid phases [1–18]. At the moment it is known that nanoparticles of various minerals and metals can increase lifetime of gas bubbles in hydrocarbon media and the stability of globules in hydrocarbon or aqueous phase in various types of emulsions [1–7, 12]. But in the industry there is no single understanding and explanation of physicochemical processes occurring at the boundaries of phases in the presence of nanoparticles under reservoir conditions or even in bench tests on rock cores. In this connection, the direction of nanoscale particles application in the oil and gas fields development is promising for carrying out complex R&D in order to reveal new scientific information and introduce high-performance inventions into the industry. The article presents the results of the next stage in complex research of silicon dioxide nanoparticles (SiO2 impact onto rheological and stability properties of emulsion systems. The complex research is performed within the framework of international project «Development and implementation of water-blocking agents based on application of SiO2 nanoparticles». The results of comparative research of new emulsion systems showed the dependences between shear stress and shear rate gradient (flow curve, dynamic viscosity and the shear rate (viscosity curve, and dynamic viscosity and volume of aqueous calcium chloride addition.

  18. Silicon dioxide with a silicon interfacial layer as an insulating gate for highly stable indium phosphide metal-insulator-semiconductor field effect transistors

    Science.gov (United States)

    Kapoor, V. J.; Shokrani, M.

    1991-01-01

    A novel gate insulator consisting of silicon dioxide (SiO2) with a thin silicon (Si) interfacial layer has been investigated for high-power microwave indium phosphide (InP) metal-insulator-semiconductor field effect transistors (MISFETs). The role of the silicon interfacial layer on the chemical nature of the SiO2/Si/InP interface was studied by high-resolution X-ray photoelectron spectroscopy. The results indicated that the silicon interfacial layer reacted with the native oxide at the InP surface, thus producing silicon dioxide, while reducing the native oxide which has been shown to be responsible for the instabilities in InP MISFETs. While a 1.2-V hysteresis was present in the capacitance-voltage (C-V) curve of the MIS capacitors with silicon dioxide, less than 0.1 V hysteresis was observed in the C-V curve of the capacitors with the silicon interfacial layer incorporated in the insulator. InP MISFETs fabricated with the silicon dioxide in combination with the silicon interfacial layer exhibited excellent stability with drain current drift of less than 3 percent in 10,000 sec, as compared to 15-18 percent drift in 10,000 sec for devices without the silicon interfacial layer. High-power microwave InP MISFETs with Si/SiO2 gate insulators resulted in an output power density of 1.75 W/mm gate width at 9.7 GHz, with an associated power gain of 2.5 dB and 24 percent power added efficiency.

  19. Enhanced Visible Transmittance of Thermochromic VO2 Thin Films by SiO2 Passivation Layer and Their Optical Characterization

    Directory of Open Access Journals (Sweden)

    Jung-Hoon Yu

    2016-07-01

    Full Text Available This paper presents the preparation of high-quality vanadium dioxide (VO2 thermochromic thin films with enhanced visible transmittance (Tvis via radio frequency (RF sputtering and plasma enhanced chemical vapor deposition (PECVD. VO2 thin films with high Tvis and excellent optical switching efficiency (Eos were successfully prepared by employing SiO2 as a passivation layer. After SiO2 deposition, the roughness of the films was decreased 2-fold and a denser structure was formed. These morphological changes corresponded to the results of optical characterization including the haze, reflectance and absorption spectra. In spite of SiO2 coating, the phase transition temperature (Tc of the prepared films was not affected. Compared with pristine VO2, the total layer thickness after SiO2 coating was 160 nm, which is an increase of 80 nm. Despite the thickness change, the VO2 thin films showed a higher Tvis value (λ 650 nm, 58% compared with the pristine samples (λ 650 nm, 43%. This enhancement of Tvis while maintaining high Eos is meaningful for VO2-based smart window applications.

  20. Research of high-hardness and wear-resistant SiO2 film coating on acrylic substrates

    Science.gov (United States)

    Yao, Yu-ting; Cheng, Yan; Deng, Xiu-mei; Jiang, Jin-hu; Zhu, Xiao-bo; Gu, Wen-hua

    2017-10-01

    Acrylic (PMMA) possesses excellent optical transparency, good chemical stability as well as many other merits such as the feasibilities in dyeing and manufacturing. But its poor hardness and wear resistance restrict its industrialized applications. In order to improve the hardness and wear resistance, SiO2 films were coated on PMMA substrates by both dip coating method and aerosol spraying method in this work. Heating curing method was carried out after the coating of SiO2 film, and consequently, the mechanical properties, optical properties and surface morphology were characterized and compared. The experimental results showed that the SiO2 films prepared by aerosol spraying method has a better performance in both hardness and wear resistance, compared with the films prepared by dip coating method. In the optimized conditions, the hardness of the PMMA was improved from 3H to 8H, and the non-abrasion rubbing times increased from less than 100 times to 5000 times with a loading of 500g weight after the coating of SiO2 film, indicating the improvement of the wear resistance.

  1. Effects of SiO2 and TiO2 fillers on thermal and dielectric properties ...

    Indian Academy of Sciences (India)

    Administrator

    . In consideration of the desired properties of ... dielectric properties for its construction such as white back (rear glass dielectric layer), barrier rib ..... bution of residual SiO2 and TiO2 fillers in the glass matrix. The sintering of glass frits at such a ...

  2. SiO $ _2 $/TiO $ _2 $ multi-layered thin films with self-cleaning and ...

    Indian Academy of Sciences (India)

    Self-cleaning, high transmittance glazing was obtained by cold spray deposition for glazings. The thin films contain TiO 2 , SiO 2 and Au nanoparticles in different structures which allow for tailoring the optical, hydrophilic and photocatalytic properties. The crystallinity, morphology and surface energy were correlated with the ...

  3. Deposition of conductive TiN shells on SiO2 nanoparticles with a fluidized bed ALD reactor

    NARCIS (Netherlands)

    Didden, A.; Hillebrand, P.; Wollgarten, M.; Dam, B.; Van de Krol, R.

    2016-01-01

    Conductive TiN shells have been deposited on SiO2 nanoparticles (10–20 nm primary particle size) with fluidized bed atomic layer deposition using TDMAT and NH3 as precursors. Analysis of the powders confirms that shell growth saturates at approximately 0.4 nm/cycle at TDMAT doses of >1.2 mmol/g of

  4. High thermal stability of abrupt SiO2/GaN interface with low interface state density

    Science.gov (United States)

    Truyen, Nguyen Xuan; Taoka, Noriyuki; Ohta, Akio; Makihara, Katsunori; Yamada, Hisashi; Takahashi, Tokio; Ikeda, Mitsuhisa; Shimizu, Mitsuaki; Miyazaki, Seiichi

    2018-04-01

    The effects of postdeposition annealing (PDA) on the interface properties of a SiO2/GaN structure formed by remote oxygen plasma-enhanced chemical vapor deposition (RP-CVD) were systematically investigated. X-ray photoelectron spectroscopy clarified that PDA in the temperature range from 600 to 800 °C has almost no effects on the chemical bonding features at the SiO2/GaN interface, and that positive charges exist at the interface, the density of which can be reduced by PDA at 800 °C. The capacitance-voltage (C-V) and current density-SiO2 electric field characteristics of the GaN MOS capacitors also confirmed the reduction in interface state density (D it) and the improvement in the breakdown property of the SiO2 film after PDA at 800 °C. Consequently, a high thermal stability of the SiO2/GaN structure with a low fixed charge density and a low D it formed by RP-CVD was demonstrated. This is quite informative for realizing highly robust GaN power devices.

  5. Flexible SiO2 cantilevers for torsional self-aligning micro scale four-point probes

    DEFF Research Database (Denmark)

    Kjær, Daniel; Gammelgaard, Lauge; Bøggild, Peter

    2007-01-01

    In order to successfully measure the conductivity of a sample with a four- point probe, good alignment of the electrodes to the sample is important to establish even contact pressure and contact areas of the electrodes. By incorporating a hinge in a microfabricated SiO2 mono- cantilever the ability...

  6. Wear and friction performance of PTFE filled epoxy composites with a high concentration of SiO2 particles

    NARCIS (Netherlands)

    Shen, J.T.; Top, M.; Pei, Y.T.; de Hosson, Jeff

    2015-01-01

    In this work, the tribological performance of PTFE filled SiO2 particles–epoxy composites is investigated. Under a load of 60 N (~140 MPa contact pressure), the optimum content of PTFE lies between 10 and 15 wt%, which yields an ultralow coefficient of friction (CoF) in conjunction with a low wear

  7. Influence of SiO2 Addition on Properties of PTFE/TiO2 Microwave Composites

    Science.gov (United States)

    Yuan, Ying; Wang, Jie; Yao, Minghao; Tang, Bin; Li, Enzhu; Zhang, Shuren

    2018-01-01

    Composite substrates for microwave circuit applications have been fabricated by filling polytetrafluoroethylene (PTFE) polymer matrix with ceramic powder consisting of rutile TiO2 ( D 50 ≈ 5 μm) partially substituted with fused amorphous SiO2 ( D 50 ≈ 8 μm) with composition x vol.% SiO2 + (50 - x) vol.% TiO2 ( x = 0, 3, 6, 9, 12), and the effects of SiO2 addition on characteristics such as the density, moisture absorption, microwave dielectric properties, and thermal properties systematically investigated. The results show that the filler was well distributed throughout the matrix. High dielectric constant ( ɛ r > 7.19) and extremely low moisture absorption (PTFE polymer, retarding its decomposition. The temperature coefficient of dielectric constant ( τ ɛ ) of the composites shifted toward the positive direction (from - 309 ppm/°C to - 179 ppm/°C) as the SiO2 content was increased, while the coefficient of thermal expansion remained almost unchanged (˜ 35 ppm/°C).

  8. Electromagnetic property of SiO2-coated carbonyl iron/polyimide composites as heat resistant microwave absorbing materials

    Science.gov (United States)

    Wang, Hongyu; Zhu, Dongmei; Zhou, Wancheng; Luo, Fa

    2015-02-01

    Heat resistant microwave absorbing materials were prepared by compression molding method, using polyimide resin as matrix and SiO2 coated carbonyl iron (CI) as filler. The SiO2 coated CI particles were prepared by Stober process. The microwave absorbing properties and the effect of heat treatment on the electromagnetic properties of SiO2 coated CI/polyimide composites were investigated. When the content of SiO2 coated CI is 60 wt%, the value of minimum reflection loss decreases from -25 dB to -33 dB with the thickness increases from 1.5 mm to 2.1 mm. According to the thermal-gravimetric analyses (TGA) curves, the polyimide matrix can be used at 300 °C for long time. The complex permittivity of the composites slightly increases while the complex permeability almost keeps constant after heat treatment at 300 °C for 10 h, which indicating that the composites can be used at elevated temperature as microwave absorbing materials at the same time have good heat resistance and microwave absorption.

  9. FTIR and Raman spectroscopy of carbon nanoparticles in SiO2, ZnO and NiO matrices

    CSIR Research Space (South Africa)

    Katumba, G

    2008-11-01

    Full Text Available Coatings of carbon nanoparticles dispersed in SiO2, ZnO and NiO matrices on aluminium substrates have been fabricated by a sol–gel technique. Spectrophotometry was used to determine the solar absorptance and the thermal emittance of the composite...

  10. Matrix solid-phase dispersion extraction of organophosphorus pesticide using SiO2-poly(N-vinylimidazole)

    International Nuclear Information System (INIS)

    Gutiérrez-Solís, M C; Muñoz-Rodríguez, D; Carrera-Figueiras, C; Ávila-Ortega, A; Medina-Peralta, S

    2013-01-01

    A sorbent material based on silica particles modified with poly(N-vinylimidazole) (SiO 2 -PVI) has been evaluated for the treatment of samples by matrix solid-phase dispersion (MSPD). The extraction of four organophosphorus pesticides was done from a spiked tomato and the extracts were analyzed by gas chromatography coupled to mass spectrometry. Six elution solvents were evaluated and acetone was selected due to better recovery of the four pesticides and low background signal in the chromatograms. A factorial design 2 4 was used for selection of extraction conditions. The factors were contact time, acetone volume, treatment (with or without freeze-drying) and adsorbent (SiO 2 or SiO 2 -PVI). The best recoveries were obtained using 15 minutes of contact, 2 mL of solvent and sorbent without freeze-drying. The recoveries were between 60 and 83% for SiO 2 -PVI in spiked tomato with 0.2 and 0.8μg/g.

  11. Efficient catalytic ozonation by ruthenium nanoparticles supported on SiO2 or TiO2: Towards the use of a non-woven fiber paper as original support

    KAUST Repository

    Biard, Pierre-François

    2015-12-24

    This work focuses on the use of Ru(0) nanoparticles as heterogeneous catalyst for ozone decomposition and radical production. In a first set of experiments, the nanoparticles have been deposited on two inorganic supports (TiO2 or SiO2) by a wet impregnation approach. This study confirmed the high potential of Ru nanoparticles as active species for ozone decomposition at pH 3, since the ozone half-life time decreases by a factor 20-25, compared to the reference experiment carried out without any catalyst. The enhancement of the ozone decomposition kinetics provided an improved radical production and a higher transient radical concentration in a shorten ozone exposure. Consequently, lower oxidant dosage and contact time would be necessary. Thus, very significant atrazine consumption kinetics enhancements were measured. In a second set of experiments, a non-woven fiber paper composed of a TiO2/SiO2/zeolite mixture has been evaluated as an original support for ruthenium nanoparticles. Even if lower ozone decomposition kinetics was observed compared to TiO2 or SiO2, this support would be a promising alternative to inorganic powders to avoid the catalyst recovery step and to design reactors such as tubular reactors. A new numerical procedure is presented for the evaluation of the transient HO° concentration and of the Rct.

  12. Influence of ionic strength in the adsorption and during photocatalysis of reactive black 5 azo dye on TiO2 coated on non woven paper with SiO2 as a binder

    International Nuclear Information System (INIS)

    Aguedach, Abdelkahhar; Brosillon, Stephan; Morvan, Jean; Lhadi, El Kbir

    2008-01-01

    Reactive black 5 (RB5), an azo dye, was degraded by using UV-irradiated TiO 2 coated on non woven paper with SiO 2 as a binder. The adsorption capacity of the photocatalyst was studied at natural pH, superior to pH pzc of the binder, for various ionic strengths. Different salts such as NaCl, KCl, CaCl 2 , LiCl, Ca(NO 3 ) 2 were used to increase the ionic strength. The presence of salt increased the adsorption capacity. The electrostatic interactions between dye and oxide surface charges (TiO 2 /SiO 2 ) is very important in the adsorption phenomena. The effect of the ionic strength of the solution on photocatalyst degradation was studied. The rate of degradation was increased by the presence of salts in the range of the experimental conditions. The increase of the initial decolorization rate was observed in the following order: Ca 2+ > K + > Na + > Li + . Experiments with different anions (Cl - , NO 3 - ) had shown that nitrate was an indifferent electrolyte for the adsorption and photodegradation of the dye on SiO 2 /TiO 2

  13. Nanoindentation Hardness Measurement in Piling up SiO2 Coating

    Science.gov (United States)

    Cabibbo, M.; Ciccarelli, D.; Spigarelli, S.

    In the last decades much attention has been focused on understanding the factors controlling the shape of the unloading curves obtained by the Oliver and Pharr nanoindentation analysis in order to estimate true contact area, and material parameters such as Young's modulus and hardness. In fact, it is well known that the Oliver and Pharr analysis can overestimate the hardness of materials that plastically deform due to piling up around the indentation. In recent years, different visual and analytical methods have been proposed. The visual methods are based on direct measurements of the produced indentation by scanning probe microscopy (SPM) or by atomic force microscopy (AFM). In the present work, indentation hardness of a SiO2 coating was measured and analyzed by both visual and analytical methods. The SPM-based direct method showed a quite good qualitative and quantitative literature data agreement. This method was thus developed and improved to make it dependent on curve parameters, such as applied load and penetration depth, rather than on SPM measurements of the actual contact area. A correlation of the pile up phenomenon to the m exponent of the P = B(h-hf)m relationship was also discussed.

  14. Optical transitions of self-trapped holes in amorphous SiO2

    International Nuclear Information System (INIS)

    Sasajima, Y.; Tanimura, K.

    2003-01-01

    Optical and electron-spin resonance (ESR) spectroscopy studies of low-temperature electron-irradiated amorphous SiO 2 were carried out to identify optical transitions of self-trapped holes (STHs). Spectroscopic analysis by means of polarized optical bleaching and thermal annealing has revealed two components comprising an absorption band around 2.2 eV: the low-energy component peaking at 2.16 eV and the high energy component at 2.60 eV. These bands are formed with similar yields in three different samples that include different chemical impurities and native defect concentrations. Based on quantitative correlations between ESR signals and optical absorption strengths, the 2.16-eV band is attributed to the two-center type STH, while the 2.60-eV band is attributed to the one-center STH. The origin of STH optical transitions is discussed based on the results of this work and recent theoretical data

  15. Non-iridescent structural colors from uniform-sized SiO2 colloids

    Science.gov (United States)

    Topçu, Gökhan; Güner, Tuğrul; Demir, Mustafa M.

    2018-05-01

    Structural colors have recently attracted interest from diverse fields of research due to their ease of fabrication and eco-friendliness. These types of colors are, in principle, achieved by periodically arranged submicron-diameter colloidal particles. The interaction of light with a structure containing long-range ordered colloidal particles leads to coloration; this usually varies depending on the angle of observation (iridescence). However, the majority of the applications demand constant color that is independent of the viewing angle (non-iridescence). In this work, silica colloids were obtained using the Stöber method at different sizes from 150 to 300 nm in an alcoholic dispersion. The casting of the dispersion on a substrate leaves behind a photonic crystal showing a colorful iridescent film. However, centrifugation and redispersion of the SiO2 particles into fresh solvent may cause the formation of small, aggregated silica domains in the new dispersion. The casting of this dispersion allows for the development of photonic glass, presumably due to the accumulation of aggregates showing stable colloidal film independent of viewing angle. Moreover, depending on the size of the silica colloids, non-iridescent photonic glasses with various colors (violet, blue, green, and orange) are obtained.

  16. Engineering of SiO2 Nanoparticles for Optimal Performance in Nano Cement-Based Materials

    Science.gov (United States)

    Sobolev, K.; Flores, I.; Torres-Martinez, L. M.; Valdez, P. L.; Zarazua, E.; Cuellar, E. L.

    The reported research examined the effect of 5-70 nm SiO2 nanoparticles on the mechanical properties of nano-cement materials. The strength development of portland cement with nano-SiO2 and superplasticizing admixture was investigated. Experimental results demonstrate an increase in the compressive and flexural strength of mortars with developed nanoparticles. The distribution of nano-SiO2 particles within the cement paste plays an essential role and governs the overall performance of these products. Therefore, the addition of a superplasticizer was proposed to facilitate the distribution of nano-SiO2 particles. Superplasticized mortars with 0.25% of selected nano-SiO2 demonstrated a 16% increase of 1-day compressive strength, reaching 63.9 MPa; the 28-day strength of these mortars was 95.9 MPa (vs. strength of reference superplasticized mortars of 92.1 MPa). Increase of 28-day flexural strength of superplasticized mortars with selected nano-SiO2 was 18%, reaching 27.1 MPa. It is concluded that the effective dispersion of nanoparticles is essential to obtain composite materials with improved performance.

  17. Crystallization of a Li2O2SiO2 Glass under High Hydrostatic Pressures

    Science.gov (United States)

    Fuss, T.; Day, D. E.; Lesher, C. E.; Ray, C. S.

    2004-01-01

    The crystallization behavior of a Li2O.2SiO2 (LS2) glass subjected to a uniform hydrostatic pressure of 4.5 or 6 GPa was investigated between 550 and 800 C using XRD, IR, Raman, TEM, NMR, and DTA. The density of the glass subjected to 6 GPa was between 2.52 plus or minus 0.01 and 2.57 plus or minus 0.01 grams per cubic centimeters, depending upon the processing temperatures, and was higher than that of the stoichiometric LS2 crystals, 2.46 plus or minus 0.01 grams per cubic centimeter. Thus, crystallization in 6 GPa glass occurred in a condition of negative volume dilatation, deltaV = V(sub glass) - V(sub crystal), while that for the 4.5 GPa glass occurred in the condition deltaV greater than 0. For deltaV greater than 0, which also includes the control glass at ambient (one atmosphere) pressure, the glasses always crystallize Li2Si2O5 (orthorhombic, Ccc2) crystals, but for deltaV less than 0 (6 GPa), the glasses crystallize Li2SiO3 crystals with a slightly deformed structure. The crystal growth rate vs. temperature curve moved to higher temperature with increasing pressure, and was independent of the sign of deltaV. These results for the effect of hydrostatic pressure on the crystallization of LS2 glass were discussed from thermodynamic considerations.

  18. Ordered Ag nanocluster structures by vapor deposition on pre-patterned SiO2.

    Science.gov (United States)

    Numazawa, Satoshi; Ranjan, Mukesh; Heinig, Karl-Heinz; Facsko, Stefan; Smith, Roger

    2011-06-08

    Highly ordered Ag nanocluster structures have been grown on pre-patterned amorphous SiO(2) surfaces by oblique angle physical vapor deposition at room temperature. Despite the small undulation of the rippled surface, the stripe-like Ag nanoclusters are very pronounced, reproducible and well separated. Computer modeling of the growth has been performed with a lattice-based kinetic Monte Carlo (KMC) method using a combination of a simplified inter-atomic potential and experimental transition barriers taken from the literature. An effective transition event classification method is introduced which allows a boost factor of several thousand compared to a traditional KMC approach, thus allowing experimental time scales to be modeled. The simulation predicts a low sticking probability for the arriving atoms, millisecond order lifetimes for single Ag adatoms and ≈1 nm square surface migration ranges of Ag adatoms. It is also shown that metal nucleations can trigger even on defect free surfaces. The simulations give excellent reproduction of the experimentally observed nanocluster growth patterns.

  19. Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography

    Science.gov (United States)

    2011-01-01

    Silicon nanoclusters are of prime interest for new generation of optoelectronic and microelectronics components. Physical properties (light emission, carrier storage...) of systems using such nanoclusters are strongly dependent on nanostructural characteristics. These characteristics (size, composition, distribution, and interface nature) are until now obtained using conventional high-resolution analytic methods, such as high-resolution transmission electron microscopy, EFTEM, or EELS. In this article, a complementary technique, the atom probe tomography, was used for studying a multilayer (ML) system containing silicon clusters. Such a technique and its analysis give information on the structure at the atomic level and allow obtaining complementary information with respect to other techniques. A description of the different steps for such analysis: sample preparation, atom probe analysis, and data treatment are detailed. An atomic scale description of the Si nanoclusters/SiO2 ML will be fully described. This system is composed of 3.8-nm-thick SiO layers and 4-nm-thick SiO2 layers annealed 1 h at 900°C. PMID:21711666

  20. Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography

    Directory of Open Access Journals (Sweden)

    Gourbilleau Fabrice

    2011-01-01

    Full Text Available Abstract Silicon nanoclusters are of prime interest for new generation of optoelectronic and microelectronics components. Physical properties (light emission, carrier storage... of systems using such nanoclusters are strongly dependent on nanostructural characteristics. These characteristics (size, composition, distribution, and interface nature are until now obtained using conventional high-resolution analytic methods, such as high-resolution transmission electron microscopy, EFTEM, or EELS. In this article, a complementary technique, the atom probe tomography, was used for studying a multilayer (ML system containing silicon clusters. Such a technique and its analysis give information on the structure at the atomic level and allow obtaining complementary information with respect to other techniques. A description of the different steps for such analysis: sample preparation, atom probe analysis, and data treatment are detailed. An atomic scale description of the Si nanoclusters/SiO2 ML will be fully described. This system is composed of 3.8-nm-thick SiO layers and 4-nm-thick SiO2 layers annealed 1 h at 900°C.

  1. Hydrogen-related radiation defects in SiO2-based glasses

    International Nuclear Information System (INIS)

    Skuja, Linards; Kajihara, Koichi; Hirano, Masahiro; Hosono, Hideo

    2008-01-01

    Spectroscopic properties of hydrogen atom trapped in an oxygen vacancy in SiO 2 glass were studied. Samples were loaded with D 2 and H 2 gases to convert O vacancies to pairs of Si-D and Si-H groups, and subsequently irradiated by F 2 laser in order to destroy some of these groups. Electron paramagnetic resonance, infrared absorption and visible/UV absorption spectra were measured. Proton hyperfine doublet with splitting of 1.05 mT was found in all H 2 -treated/irradiated samples. UV-bleaching treatment showed that this signal is independent of the other, well-known hydrogen-related signals in silica. The size of the hyperfine splitting corresponds to twice the 1 H nuclear Zeeman splitting in applied magnetic field. The observed 1.05 mT doublet is tentatively attributed to the forbidden nuclear spin-flip transitions of proton trapped in an oxygen vacancy in silica. The allowed EPR transitions of this center are not resolved, possibly reflecting a variation in Si...H distance in oxygen vacancy with a trapped H atom

  2. Neutron irradiation effects in amorphous SiO2: optical absorption and electron paramagnetic resonance

    International Nuclear Information System (INIS)

    Guzzi, M.; Martini, M.; Paleari, A.; Pio, F.; Vedda, A.; Azzoni, C.B.

    1993-01-01

    Optical absorption spectra of as-grown and neutron-irradiated amorphous SiO 2 , both fused natural quartz and synthetic silica, have been analysed in the ultraviolet region below the fundamental edge. The description of the optical spectrum has been further clarified by a detailed study of the spectral components as a function of the neutron irradiation in different types of silica; we have verified known correlations between optical bands and between bands and paramagnetic centres. In 'as-grown' fused quartz samples, a previously unreported band at 6.2 eV has been detected. 'As-grown' synthetic silicas do not show any band, up to the intrinsic absorption edge. In the irradiated samples, the experimental results suggest a correlation between two bands at 5.8 and 7.1 eV, while previous attribution of the bands at 5.0 eV (B 2 band) and 7.6 eV (E band) to the same defect is discussed. The role of impurities in the optical absorption and in the radiation hardness is also considered. (author)

  3. Dewetting induced Au-Ge composite nanodot evolution in SiO2

    Science.gov (United States)

    Datta, D. P.; Chettah, A.; Siva, V.; Kanjilal, D.; Sahoo, P. K.

    2018-01-01

    A composite nanostructure comprising of Au and Ge gradually evolves on SiO2 surface when a bilayer of Au and Ge is irradiated by medium keV Xe-ion beam. The morphology progresses through different stages from nucleating patches to extended islands and finally a Au-Ge composite nanodot array develops on the insulator surface. While ion energy and fluence are found to determine dimensions of the nanostructures, existence of a characteristic lateral length scale is also detected at every stage of evolution. Through morphological and compositional analysis, the observed evolution is understood as an effect of ion beam induced dewetting of Au top layer. Numerical estimation based on the unified thermal spike model using the present experimental condition demonstrates formation of molten zones around the ion track due to nuclear and electronic energy deposition in the target. Dewetting results from mass flow onto the surface driven by local melting along the ion track and combines with sputter erosion of the bilayer film to lead to composite nanodot evolution. The generality of the ion induced processes provides possible route towards metal-semiconductor hybrid nanostructure synthesis on insulator surface.

  4. Porous asymmetric SiO2-g-PMMA nanoparticles produced by phase inversion

    KAUST Repository

    Munirasu, Selvaraj

    2014-07-22

    A new kind of asymmetric organic-inorganic porous structure has been proposed. Asymmetric lattices of polymer grafted silica nanoparticles were manufactured by casting and phase inversion in water. Silica nanoparticles were first functionalized with 3-(dimethylethoxysilyl)propyl-2-bromoisobutyrate, followed by grafting of poly(methylmethacrylate) (PMMA) segments, performed by atom-transfer radical polymerization. Mechanically stable self-standing films were prepared by casting a dispersion of functionalized nanoparticles in different solvents and immersion in water. The resulting asymmetrically porous morphology and nanoparticle assembly was characterized by scanning electron and atomic force microscopy. The PMMA functionalized SiO2 hybrid material in acetone or acetone/dioxane led to the best-assembled structures. Porous asymmetric membranes were prepared by adding free PMMA and PMMA terminated with hydrophilic hydroxyl group. Nitrogen flow of 2800 L m-2 h -1 was measured at 1.3 bar demonstrating the porosity and potential application for membrane technology. © 2014 Springer Science+Business Media New York.

  5. Regulating effect of SiO2 interlayer on optical properties of ZnO thin films

    International Nuclear Information System (INIS)

    Xu, Linhua; Zheng, Gaige; Miao, Juhong; Su, Jing; Zhang, Chengyi; Shen, Hua; Zhao, Lilong

    2013-01-01

    ZnO/SiO 2 nanocomposite films with periodic structure were prepared by electron beam evaporation technique. Regulating effect of SiO 2 interlayer with various thicknesses on the optical properties of ZnO/SiO 2 thin films was investigated deeply. The analyses of X-ray diffraction show that the ZnO layers in ZnO/SiO 2 nanocomposite films have a wurtzite structure and are preferentially oriented along the c-axis while the SiO 2 layers are amorphous. The scanning electron microscope images display that the ZnO layers are composed of columnar grains and the thicknesses of ZnO and SiO 2 layers are all very uniform. The SiO 2 interlayer presents a significant modulation effect on the optical properties of ZnO thin films, which is reflected in the following two aspects: (1) the transmittance of ZnO/SiO 2 nanocomposite films is increased; (2) the photoluminescence (PL) of ZnO/SiO 2 nanocomposite films is largely enhanced compared with that of pure ZnO thin films. The ZnO/SiO 2 nanocomposite films have potential applications in light-emitting devices and flat panel displays. -- Highlights: ► ZnO/SiO 2 nanocomposite films with periodic structure were prepared by electron beam evaporation technique. ► The SiO 2 interlayer presents a significant modulation effect on the optical properties of ZnO thin films. ► The photoluminescence of ZnO/SiO 2 nanocomposite films is largely enhanced compared with that of pure ZnO thin films. ► The ZnO/SiO 2 nanocomposite films have potential applications in light-emitting devices and flat panel displays

  6. Improving thermal insulation of TC4 using YSZ-based coating and SiO2 aerogel

    Directory of Open Access Journals (Sweden)

    Lei Jin

    2015-04-01

    Full Text Available In this paper, air plasmas spray (APS was used to prepare YSZ and Sc2O3–YSZ (ScYSZ coating in order to improve the thermal insulation ability of TC4 alloy. SiO2 aerogel was also synthesized and affixed on TC4 titanium alloy to inhabit thermal flow. The microstructures, phase compositions and thermal insulation performance of three coatings were analyzed in detail. The results of thermal diffusivity test by a laser flash method showed that the thermal diffusivities of YSZ, Sc2O3–YSZ and SiO2 aerogel are 0.553, 0.539 and 0.2097×10−6 m2/s, respectively. Then, the thermal insulation performances of three kinds of coating were investigated from 20 °C to 400 °C using high infrared radiation heat flux technology. The experimental results indicated that the corresponding temperature difference between the top TC4 alloy (400 °C and the bottom surface of YSZ is 41.5 °C for 0.6 mm thickness coating. For 1 mm thickness coating, the corresponding temperature difference between the top TC4 alloys (400 °C and the bottom surface of YSZ, ScYSZ, SiO2 aerogel three specimens is 54, 54.6 and 208 °C, respectively. The coating thickness and species were found to influence the heat insulation ability. In these materials, YSZ and ScYSZ exhibited a little difference for heat insulation behavior. However, SiO2 aerogel was the best one among them and it can be taken as protection material on TC4 alloys. In outer space, SiO2 aerogel can meet the need of thermal insulation of TC4 of high-speed aircraft.

  7. Chemical Bonding, Interfaces and Defects in Hafnium Oxide/Germanium Oxynitride Gate Stacks on Ge (100)

    Energy Technology Data Exchange (ETDEWEB)

    Oshima, Yasuhiro; /Stanford U., Materials Sci. Dept.; Sun, Yun; /SLAC, SSRL; Kuzum, Duygu; /Stanford U.; Sugawara, Takuya; Saraswat, Krishna C.; Pianetta, Piero; /SLAC, SSRL; McIntyre, Paul C.; /Stanford U., Materials Sci. Dept.

    2008-10-31

    Correlations among interface properties and chemical bonding characteristics in HfO{sub 2}/GeO{sub x}N{sub y}/Ge MIS stacks were investigated using in-situ remote nitridation of the Ge (100) surface prior to HfO{sub 2} atomic layer deposition (ALD). Ultra thin ({approx}1.1 nm), thermally stable and aqueous etch-resistant GeO{sub x}N{sub y} interfaces layers that exhibited Ge core level photoelectron spectra (PES) similar to stoichiometric Ge{sub 3}N{sub 4} were synthesized. To evaluate GeO{sub x}N{sub y}/Ge interface defects, the density of interface states (D{sub it}) was extracted by the conductance method across the band gap. Forming gas annealed (FGA) samples exhibited substantially lower D{sub it} ({approx} 1 x 10{sup 12} cm{sup -2} eV{sup -1}) than did high vacuum annealed (HVA) and inert gas anneal (IGA) samples ({approx} 1x 10{sup 13} cm{sup -2} eV{sup -1}). Germanium core level photoelectron spectra from similar FGA-treated samples detected out-diffusion of germanium oxide to the HfO{sub 2} film surface and apparent modification of chemical bonding at the GeO{sub x}N{sub y}/Ge interface, which is related to the reduced D{sub it}.

  8. Cytokine induction of sol–gel-derived TiO2 and SiO2 coatings on metallic substrates after implantation to rat femur

    Science.gov (United States)

    Urbanski, Wiktor; Marycz, Krzysztof; Krzak, Justyna; Pezowicz, Celina; Dragan, Szymon Feliks

    2017-01-01

    Material surface is a key determinant of host response on implanted biomaterial. Therefore, modification of the implant surface may optimize implant–tissue reactions. Inflammatory reaction is inevitable after biomaterial implantation, but prolonged inflammation may lead to adverse reactions and subsequent implant failure. Proinflammatory activities of cytokines like interleukin (IL)-1, IL-6, and tumor necrosis factor-alpha (TNF-α) are attractive indicators of these processes and ultimately characterize biocompatibility. The objective of the study was to evaluate local cytokine production after implantation of stainless steel 316L (SS) and titanium alloy (Ti6Al4V) biomaterials coated with titanium dioxide (TiO2) and silica (SiO2) coatings prepared by sol–gel method. Biomaterials were implanted into rat femur and after 12 weeks, bones were harvested. Bone–implant tissue interface was evaluated; immunohistochemical staining was performed to identify IL-6, TNF-α, and Caspase-1. Histomorphometry (AxioVision Rel. 4.6.3 software) of tissue samples was performed in order to quantify the cytokine levels. Both the oxide coatings on SS and Ti6Al4V significantly reduced cytokine production. However, the lowest cytokine levels were observed in TiO2 groups. Cytokine content in uncoated groups was lower in Ti6Al4V than in SS, although coating of either metal reduced cytokine production to similar levels. Sol–gel TiO2 or SiO2 coatings reduced significantly the production of proinflammatory cytokines by local tissues, irrespective of the material used as a substrate, that is, either Ti6Al4V or SS. This suggests lower inflammatory response, which directly points out improvement of materials’ biocompatibility. PMID:28280331

  9. MoO3/SiO2-ZrO2 Catalyst: Eeffect of Calcination Temperature on Physico-chemical Properties and Activities in Nitration of Toluene

    Directory of Open Access Journals (Sweden)

    Sunil Madhavrao Kemdeo

    2012-12-01

    Full Text Available 12 wt % molybdena was deposited over 1:1 silica zirconia mixed oxide support and the resultant catalyst was calcined between the 500 to 700 oC range of temperature. The samples were characterized by XRD, FT-IR, BET, SEM, NH3-TPD and pyridine adsorbed FT-IR techniques.  Nitration of toluene was studied as a model reaction over the prepared catalysts and parameters like effect of reaction temperature, effect of various solvents, catalyst reusability are studied. It was found that conversion of toluene varies with the presence of Brönsted acid sites over the catalyst surface and para-nitrotoulene selectivity is associated with pore size of the catalyst. Over the same catalysts, nitration was extended for some other aromatics. Avoid of sulfuric acid in the present process is an interesting concern in view of green chemistry. Copyright © 2012 by BCREC UNDIP. All rights reservedKeywords: MoO3/SiO2-ZrO2; SO2-ZrO2; NH3-TPD; Nitration; ortho-nitro tolueneReceived: 19th May 2012, Revised: 24th May 2012, Accepted: 26th May 2012[How to Cite: S.M. Kemdeo. (2012. MoO3/SiO2-ZrO2 Catalyst: Effect of Calcination Temperature on Physico-chemical Properties and Activities in Nitration of Toluene. Bulletin of Chemical Reaction Engineering & Catalysis, 7 (2: 92-104. doi:10.9767/bcrec.7.2.3521.92-104] [How to Link / DOI: http://dx.doi.org/10.9767/bcrec.7.2.3521.92-104 || or local: http://ejournal.undip.ac.id/index.php/bcrec/article/view/3521] | View in 

  10. Comparative Study of the Optical and Textural Properties of Tetrapyrrole Macrocycles Trapped Within ZrO2, TiO2, and SiO2 Translucent Xerogels

    Directory of Open Access Journals (Sweden)

    Eduardo Salas-Bañales

    2015-10-01

    Full Text Available The entrapping of physicochemical active molecules inside mesoporous networks is an appealing field of research due to the myriad of potential applications in optics, photocatalysis, chemical sensing, and medicine. One of the most important reasons for this success is the possibility of optimizing the properties that a free active species displays in solution but now trapped inside a solid substrate. Additionally it is possible to modulate the textural characteristics of substrates, such as pore size, specific surface area, polarity and chemical affinity of the surface, toward the physical or chemical adhesion of a variety of adsorbates. In the present document, two kinds of non-silicon metal alkoxides, Zr and Ti, are employed to prepare xerogels containing entrapped tetrapyrrolic species that could be inserted beforehand in analogue silica systems. The main goal is to develop efficient methods for trapping or binding tetrapyrrole macrocycles inside TiO2 and ZrO2 xerogels, while comparing the properties of these systems against those of the SiO2 analogues. Once the optimal synthesis conditions for obtaining translucent monolithic xerogels of ZrO2 and TiO2 networks were determined, it was confirmed that these substrates allowed the entrapment, in monomeric form, of macrocycles that commonly appear as aggregates within the SiO2 network. From these experiments, it could be determined that the average pore diameters, specific surface areas, and water sorption capacities depicted by each one of these substrates, are a consequence of their own nature combined with the particular structure of the entrapped tetrapyrrole macrocycle. Furthermore, the establishment of covalent bonds between the intruding species and the pore walls leads to the obtainment of very similar pore sizes in the three different metal oxide (Ti, Zr, and Si substrates as a consequence of the templating effect of the encapsulated species.

  11. Growth Mode Study of MgCl2 on Ti (0001 and SiO2 under Ultra High Vacuum by XPS

    Directory of Open Access Journals (Sweden)

    S. Karakalos

    2012-12-01

    Full Text Available The growth mode of MgCl2 on Ti (0001 and on SiO2 grown on Si (100 was investigated by X-ray Photoelectron Spectroscopy (XPS under UHV conditions. Magnesium chloride grows on both Ti (0001 single crystal and SiO2 following the Frank-van der Merve, (FM growth mode.

  12. Energy transfer between doubly doped Er3+, Tm3+and Ho3+ rare earth ions in SiO2 nanoparticles

    CSIR Research Space (South Africa)

    Dhlamini, MS

    2011-04-01

    Full Text Available Preparation of Er3+, Ho3+ and Tm3+ ions co-doped SiO2 nanoparticle phosphor powders by sol gelmethod is reported. The morphology and the particle size of the SiO2 hostmatrix were confirmed by field emission scanning electron microscopy (FESEM...

  13. SiC/C composites prepared from wood-based carbons by pulse current sintering with SiO2 : Electrical and thermal properties

    NARCIS (Netherlands)

    Fujisawa, M; Hata, T; Bronsveld, P; Castro, [No Value; Tanaka, F; Kikuchi, H; Furuno, T; Imamura, Y

    2004-01-01

    A powder mix of wood charcoal and SiO2 was sintered into a SiC/C composite. The heat treatment temperatures were 1400-1800 degreesC, the SiO2 concentration 0, 10, 30 and 50 wt.% with respect to the dry weight of wood charcoal. The microstructure, electrical resistance and thermal conductivity were

  14. Luminescence dependence of Pr3+ activated SiO2 nanophosphor on Pr3+ concentration, temperature, and ZnO incorporation

    CSIR Research Space (South Africa)

    Mhlongo, GH

    2011-08-01

    Full Text Available Green-emitting ZnO nanoparticles were successfully embedded in Pr3+-doped SiO2 by a sol–gel method resulting in a red-emitting ZnO·SiO2:Pr3+ nanocomposite phosphor. The particle morphology and luminescent properties of SiO2:Pr3+ phosphor powders...

  15. Dehydration of glucose to 5-hydroxymethylfurfural by a core-shell Fe3O4@SiO2-SO3H magnetic nanoparticle catalyst

    Science.gov (United States)

    This paper discusses the potential use of (Fe3O4@SiO2-SO3H) nanoparticle catalyst for the dehydration of glucose into 5-hydroxymethylfurfural (HMF). A magnetically recoverable (Fe3O4@SiO2-SO3H) nanoparticle catalyst was successfully prepared by supporting sulfonic acid groups (SO3H) on the surface o...

  16. Development of Microwave-Excited Plasma-Enhanced Metal-Organic Chemical Vapor Deposition System for Forming Ferroelectric Sr2(Ta1-x,Nbx)2O7 Thin Film on Amorphous SiO2

    Science.gov (United States)

    Takahashi, Ichirou; Funaiwa, Kiyoshi; Azumi, Keita; Yamashita, Satoru; Shirai, Yasuyuki; Hirayama, Masaki; Teramoto, Akinobu; Sugawa, Shigetoshi; Ohmi, Tadahiro

    2007-04-01

    Sr2(Ta1-x,Nbx)2O7 (STN; x = 0.3) is suitable for use as ferroelectric gate field-effect transistors (FETs) for one-transistor-type ferroelectric memory devices, because it has a low dielectric constant. For applications using metal-ferroelectric-insulator-semiconductor (MFIS) FETs, crystallization of ferroelectric film on insulator is necessary. Perovskite STN can be successfully obtained on amorphous SiO2 by ferroelectric-multilayer-stack (FMLS) deposition, which uses alternating steps of STN sputtering deposition and oxygen radical treatment. In this study, we report on a newly developed microwave-excited plasma-enhanced metal-organic chemical vapor deposition (MOCVD) system, in which STN can be deposited in radical oxygen atmosphere. We succeeded in the fabrication of STN on amorphous SiO2 in a single process. The IrO2/STN (200 nm)/SiO2 (10 nm)/p-type Si device shows capacitance-voltage (C-V) hysteresis curves and a memory window of 1.2 V with a 5 V writing operation.

  17. Formation of SiO2 film by chemical vapor deposition enhanced by atomic species extracted from a surface-wave generated plasma

    Science.gov (United States)

    Okada, H.; Baba, M.; Furukawa, M.; Yamane, K.; Sekiguchi, H.; Wakahara, A.

    2017-01-01

    In this study, we have investigated SiO2 deposition by chemical vapor deposition enhanced by neutral oxygen at the ground state extracted from a surface-wave generated plasma proposed by our group at 350°C using hexamethyldisilane (HMDS) as a precursor. Good properties of deposited SiO2 having refractive index of n = 1.45-1.46 have been confirmed by ellipsometry. Stoichiometric SiO2 was also confirmed by X-ray photoelectron spectroscopy (XPS) with single peak of Si 2p and O 1s. High quality SiO2 film deposition was also confirmed by Fourier transform infrared spectrometer (FT-IR) analysis indicating formation of chemical bonding in SiO2 with no unwanted bonds due to -OH or -CH3 groups.

  18. Effect of Pr Valence State on Interfacial Structure and Electrical Properties of Pr Oxide/PrON/Ge Gate Stack Structure

    Science.gov (United States)

    Kato, Kimihiko; Sakashita, Mitsuo; Takeuchi, Wakana; Kondo, Hiroki; Nakatsuka, Osamu; Zaima, Shigeaki

    2011-04-01

    In this study, we investigated the valence state and chemical bonding state of Pr in a Pr oxide/PrON/Ge structure. We clarified the relationship between the valence state of Pr and the Pr oxide/Ge interfacial reaction using Pr oxide/Ge and Pr oxide/PrON/Ge samples. We found the formation of three Pr oxide phases in Pr oxide films; hexagonal Pr2O3 (h-Pr2O3) (Pr3+), cubic Pr2O3 (c-Pr2O3) (Pr3+), and c-PrO2 (Pr4+). We also investigated the effect of a nitride interlayer on the interfacial reaction in Pr oxide/Ge gate stacks. In a sample with a nitride interlayer (Pr oxide/PrON/Ge), metallic Pr-Pr bonds are also formed in the c-Pr2O3 film. After annealing in H2 ambient, the diffusion of Ge into Pr oxide is not observed in this sample. Pr-Pr bonds probably prevent the interfacial reaction and Ge oxide formation, considering that the oxygen chemical potential of this film is lower than that of a GeO2/Ge system. On the other hand, the rapid thermal oxidation (RTO) treatment terminates the O vacancies and defects in c-Pr2O3. As a result, c-PrO2 with tetravalent Pr is formed in the Pr oxide/PrON/Ge sample with RTO. In this sample, the leakage current density is effectively decreased in comparison with the sample without RTO. Hydrogen termination works effectively in Pr oxide/PrON/Ge samples with and without RTO, and we can achieve an interface state density of as low as 4 ×1011 eV-1·cm-2.

  19. Preparation & characterization of SiO2 interface layer by dip coating technique on carbon fibre for Cf/SiC composites

    Science.gov (United States)

    Kumar, Kundan; Jariwala, C.; Pillai, R.; Chauhan, N.; Raole, P. M.

    2015-08-01

    Carbon fibres (Cf) are one of the most important reinforced materials for ceramic matrix composites such as Cf - SiC composites and they are generally sought for high temperature applications in as space application, nuclear reactor and automobile industries. But the major problem arise when Cf reinforced composites exposed to high temperature in an oxidizing environment, Cf react with oxygen and burnt away. In present work, we have studied the effect of silica (SiO2) coating as a protective coating on Cf for the Cf / SiC composites. The silica solution prepared by the sol-gel process and coating on Cf is done by dip coating technique with varying the withdrawing speed i.e. 2, 5, 8 mm/s with fixed dipping cycle (3 Nos.). The uniform silica coating on the Cf is shown by the Scanning Electron Microscope (SEM) analysis. The tensile test shows the increase in tensile strength with respect to increase in withdrawing speed. The isothermal oxidation analysis confirmed enhancement of oxidation resistance of silica coated Cf as compared tothe uncoated Cf.

  20. Improved memory performance of metal—oxide—nitride—oxide—silicon by annealing the SiO2 tunnel layer in different nitridation atmospheres

    Science.gov (United States)

    Meilin, He; Jingping, Xu; Jianxiong, Chen; Lu, Liu

    2013-11-01

    Metal—oxide—nitride—oxide—silicon (MONOS) capacitors with thermally grown SiO2 as the tunnel layer are fabricated, and the effects of different ambient nitridation (NH3, NO and N2O) on the characteristics of the memory capacitors are investigated. The experimental results indicate that the device with tunnel oxide annealed in NO ambient exhibits excellent memory characteristics, i.e. a large memory window, high program/erase speed, and good endurance and retention performance (the charge loss rate is 14.5% after 10 years). The mechanism involved is that much more nitrogen is incorporated into the tunnel oxide during NO annealing, resulting in a lower tunneling barrier height and smaller interface state density. Thus, there is a higher tunneling rate under a high electric field and a lower probability of trap-assisted tunneling during retention, as compared to N2O annealing. Furthermore, compared with the NH3-annealed device, no weak Si—H bonds and electron traps related to the hydrogen are introduced for the NO-annealed devices, giving a high-quality and high-reliability SiON tunneling layer and SiON/Si interface due to the suitable nitridation and oxidation roles of NO.

  1. Fabrication and characterization of Er+3 doped SiO2/SnO2 glass-ceramic thin films for planar waveguide applications

    Science.gov (United States)

    Guddala, S.; Chiappini, A.; Armellini, C.; Turell, S.; Righini, G. C.; Ferrari, M.; Narayana Rao, D.

    2015-02-01

    Glass-ceramics are a kind of two-phase materials constituted by nanocrystals embedded in a glass matrix and the respective volume fractions of crystalline and amorphous phase determine the properties of the glass-ceramics. Among these properties transparency is crucial in particular when confined structures, such as, dielectric optical waveguides, are considered. Moreover, the segregation of dopant rare-earth ions, like erbium, in low phonon energy crystalline medium makes these structures more promising in the development of waveguide amplifiers. Here we are proposing a new class of low phonon energy tin oxide semiconductor medium doped silicate based planar waveguides. Er3+ doped (100-x) SiO2-xSnO2 (x= 10, 20, 25 and 30mol%), glass-ceramic planar waveguide thin films were fabricated by a simple sol-gel processing and dip coating technique. XRD and HRTEM studies indicates the glass-ceramic phase of the film and the dispersion of ~4nm diameter of tin oxide nanocrystals in the amorphous phase of silica. The spectroscopic assessment indicates the distribution of the dopant erbium ions in the crystalline medium of tin oxide. The observed low losses, 0.5±0.2 dB/cm, at 1.54 μm communication wavelength makes them a quite promising material for the development of high gain integrated optical amplifiers.

  2. Photocatalytic application of TiO2/SiO2-based magnetic nanocomposite (Fe3O4@SiO2/TiO2 for reusing of textile wastewater

    Directory of Open Access Journals (Sweden)

    Laleh Enayati Ahangar

    2016-01-01

    Full Text Available In this research we have developed a treatment method for textile wastewater by TiO2/SiO2-based magnetic nanocomposite. Textile wastewater includes a large variety of dyes and chemicals and needs treatments. This manuscript presents a facile method for removing dyes from the textile wastewater by using TiO2/SiO2-based nanocomposite (Fe3O4@SiO2/TiO2 under UV irradiation. This magnetic nanocomposite, as photocatalytically active composite, is synthesized via solution method in mild conditions. A large range of cationic, anionic and neutral dyes including: methyl orange, methylene blue, neutral red, bromocresol green and methyl red are used for treatment investigations. Neutral red and bromocresol green have good results in reusing treatment. The high surface area of nanocomposites improve the kinetic of wastewater treatment. In this method, by using the magnetic properties of Fe3O4 nanoparticles, TiO2-based photocatalyst could be separated and reused for 3 times. The efficiency of this method is respectively 100% and 65% for low concentration (10 ppm and high concentration (50 ppm of neutral red and bromocrosol green after 3 h treatment. The efficiency of treatment using the second used nanocomposite was 90% for 10 ppm of the same dyes.

  3. High permittivity gate dielectric materials

    CERN Document Server

    2013-01-01

    "The book comprehensively covers all the current and the emerging areas of the physics and the technology of high permittivity gate dielectric materials, including, topics such as MOSFET basics and characteristics, hafnium-based gate dielectric materials, Hf-based gate dielectric processing, metal gate electrodes, flat-band and threshold voltage tuning, channel mobility, high-k gate stack degradation and reliability, lanthanide-based high-k gate stack materials, ternary hafnia and lanthania based high-k gate stack films, crystalline high-k oxides, high mobility substrates, and parameter extraction. Each chapter begins with the basics necessary for understanding the topic, followed by a comprehensive review of the literature, and ultimately graduating to the current status of the technology and our scientific understanding and the future prospects."

  4. Characterisation of NdFeB thin films prepared on (100)Si substrates with SiO2 barrier layers

    International Nuclear Information System (INIS)

    Sood, D.K.; Muralidhar, G.K.

    1998-01-01

    This work presents a systematic study of the deposition and characterization of NdFeB films on substrates of Si(100) and of SiO2 layer thermally grown on Si(100) held at RT, 360 deg C or 440 deg C. The post-deposition annealing is performed at 600 or 800 deg C in vacuum. The films are characterised using the analytical techniques of RBS, SIMS, XRD, OM and SEM. Results indicate that SiO2 is, in deed, an excellent diffusion barrier layer till 600 deg C but becomes relatively less effective at 800 deg C. Without this barrier layer, interdiffusion at the Si-NdFeB film interface leads to formation of iron silicides, α-Fe and B exclusion from the diffusion zone, in competition with the formation of the magnetic NdFeB phase. (authors)

  5. Additivity of kinetic and potential energy contributions in modification of graphene supported on SiO2

    Science.gov (United States)

    Zhang, Xitong; Zhao, Shijun; Wang, Yuyu; Xue, Jianming

    2017-04-01

    The damage production induced by MeV highly charged ions (HCI) irradiations in graphene supported on a SiO2 substrate is investigated using molecular dynamics method. We get results in agreement with our recent experiments. We find that the electronic energy loss and potential energy deposition have similar effects on the defects creation in SiO2 substrate-supported graphene and both mechanisms of energy deposition seem to contribute in an additive way. The influences of the energy deposition depth and radius are studied. Only the energy deposited below the surface within 2.5 nm will induce the damage in graphene. Hence, the HCI can be a powerful tool to induce defects in graphene without causing deep damage of the substrate. When charge of incident Xeq+ is above 30, a nanopore is formed and the size of nanopore in graphene can be controlled by changing the incident charge state.

  6. Highly sensitive and thermal stable CO gas sensor based on SnO2 modified by SiO2.

    Science.gov (United States)

    Zhan, Zili; Chen, Juling; Guan, Shaokang; Si, Lifen; Zhang, Pengshuai

    2013-02-01

    Effects of surface chemical modification with SiO2 on the thermal stability and CO gas-sensing properties of SnO2 were investigated. The SiO2 on the SnO2 surface effectively inhibits the nanocrystal growth of SnO2. The average size of modified SnO2 sintered at 600 degrees C is 5.8 nm. The gas sensitivity to CO was found to be markedly enhanced by the surface chemical modification. The CO gas as low as 5 ppm can be effectively detected by the modified SnO2-based sensors. At the same time, the modified SnO2-based sensor has excellent selectivity to CO, fast response and recovery properties.

  7. Biocomposite of Cassava Starch Reinforced with Cellulose Pulp Fibers Modified with Deposition of Silica (SiO2 Nanoparticles

    Directory of Open Access Journals (Sweden)

    Joabel Raabe

    2015-01-01

    Full Text Available Eucalyptus pulp cellulose fibers were modified by the sol-gel process for SiO2 superficial deposition and used as reinforcement of thermoplastic starch (TPS. Cassava starch, glycerol, and water were added at the proportion of 60/26/14, respectively. For composites, 5% and 10% (by weight of modified and unmodified pulp fibers were added before extrusion. The matrix and composites were submitted to thermal stability, tensile strength, moisture adsorption, and SEM analysis. Micrographs of the modified fibers revealed the presence of SiO2 nanoparticles on fiber surface. The addition of modified fibers improved tensile strength in 183% in relation to matrix, while moisture adsorption decreased 8.3%. Such improvements were even more effective with unmodified fibers addition. This result was mainly attributed to poor interaction between modified fibers and TPS matrix detected by SEM analysis.

  8. Soft nanoimprint lithography on SiO2 sol-gel to elaborate sensitive substrates for SERS detection

    Science.gov (United States)

    Hamouda, Frédéric; Bryche, Jean-François; Aassime, Abdelhanin; Maillart, Emmanuel; Gâté, Valentin; Zanettini, Silvia; Ruscica, Jérémy; Turover, Daniel; Bartenlian, Bernard

    2017-12-01

    This paper presents a new alternative fabrication of biochemical sensor based on surface enhanced Raman scattering (SERS) by soft nanoimprint lithography (S-NIL) on SiO2 sol-gel. Stabilization of the sol-gel film is obtained by annealing which simplifies the manufacturing of these biosensors and is compatible with mass production at low cost. This detector relies on a specific pattern of gold nanodisks on a thin gold film to obtain a better sensitivity of molecules' detection. Characterizations of SERS devices were performed on a confocal Raman microspectrophotometer after a chemical functionalization. We report a lateral collapse effect on poly(diméthylsiloxane) (PDMS) stamp for specific nanostructure dimensions. This unintentional effect is used to evaluate S-NIL resolution in SiO2 sol-gel.

  9. Effect of hydrostatic pressure on photoluminescence spectra from structures with Si nanocrystals fabricated in SiO2 matrix

    International Nuclear Information System (INIS)

    Zhuravlev, K.S.; Tyschenko, I.E.; Vandyshev, E.N.; Bulytova, N.V.; Misiuk, A.; Rebohle, L.; Skorupa, W.

    2002-01-01

    The effect of hydrostatic pressure applied at high temperature on photoluminescence of Si-implanted SiO 2 films was studied. A 'blue'-shift of PL spectrum from the SiO 2 films implanted with Si + ions to total dose of 1.2x10 17 cm -2 with increase in hydrostatic pressure was observed. For the films implanted with Si + ions to a total dose of 4.8x10 16 cm -2 high temperature annealing under high hydrostatic pressure (12 kbar) causes a 'red'-shift of photoluminescence spectrum. The 'red' photoluminescence bands are attributed to Si nanocrystals while the 'blue' ones are related to Si nanocrystals of reduced size or chains of silicon atoms or Si-Si defects. A decrease in size of Si nanocluster occurs in result of the pressure-induced decrease in the diffusion of silicon atoms. (author)

  10. Dielectric properties of bismuth titanate ceramics containing SiO2 and Nd2O3 as additives

    Directory of Open Access Journals (Sweden)

    Stanislav S. Slavov

    2012-09-01

    Full Text Available Bismuth-titanate ceramics containing SiO2 and Nd2O3 as additives are synthesized by melt quenching method in the system Bi2O3-TiO2-Nd2O3-SiO2 in the temperature range of 1250–1500 °C. The phase composition of the obtained materials is determined by X-ray diffraction analysis and energy dispersive spectroscopy. Using scanning electron microscopy different microstructures are observed in the samples depending on the composition. Different values of conductivity, dielectric losses and relative permittivity are obtained depending on the composition. It is established that all investigated samples are dielectric materials with conductivity between 10^-9 and 10^-13 (Ω·cm^-1 at room temperature, dielectric permittivity from 1000 to 3000 and dielectric losses tgδ between 0.0002 and 0.1.

  11. Silicon electrodeposition from chloride-fluoride melts containing K2SiF6 and SiO2

    Directory of Open Access Journals (Sweden)

    Zhuk Sergey I.

    2017-01-01

    Full Text Available Silicon electrodeposition on glassy carbon from the KF-KCl-K2SiF6, KF-KCl-K2SiF6-KOH and KF-KCl-K2SiF6-SiO2 melts was studied by the cyclic voltammetry. Тhe electroreduction of Si(IV to metallic Si was observed as a single 4-electron wave under all considered conditions. The reactions of cathode reduction of silicon from fluoride and oxyfluoride complexes were suggested. It was shown that the process can be controlled by the preliminary transformation of SiO44- to SiF62- and SiOxFyz-. The influence of the current density on structure and morphology of silicon deposits obtained during galvanostatic electrolysis of the KF-KCl-K2SiF6-SiO2 melt was studied.

  12. Preparation and optical properties of SiO2 stablized SnO2 quantum dot films

    International Nuclear Information System (INIS)

    Peng Qiangxiang; Li Zhijie; Zu Xiaotao

    2009-01-01

    SiO 2 stabilized SnO 2 quantum dot were prepared by sol-gel-hydrothermal process. Then SnO 2 quantum dot thin films were obtained by spin-coating with preprocess of well dispersing SnO 2 quantum dots in SiO 2 sol. The as-prepared SnO 2 quantum dots showed tetragonal rutile crystal structure and quantum dot radius of about 4.0 nm. The optical bad gap of the thin films was derived from UV-vis transmission spectra, with value of about 3.96 eV. The SnO 2 quantum dot thin films showed multi-peak photoluminescence properties at room temperature, mainly excitation emission at 356 nm and defect emission at 388 nm. (authors)

  13. High Temperature Stable Separator for Lithium Batteries Based on SiO2 and Hydroxypropyl Guar Gum

    Directory of Open Access Journals (Sweden)

    Diogo Vieira Carvalho

    2015-10-01

    Full Text Available A novel membrane based on silicon dioxide (SiO2 and hydroxypropyl guar gum (HPG as binder is presented and tested as a separator for lithium-ion batteries. The separator is made with renewable and low cost materials and an environmentally friendly manufacturing processing using only water as solvent. The separator offers superior wettability and high electrolyte uptake due to the optimized porosity and the good affinity of SiO2 and guar gum microstructure towards organic liquid electrolytes. Additionally, the separator shows high thermal stability and no dimensional-shrinkage at high temperatures due to the use of the ceramic filler and the thermally stable natural polymer. The electrochemical tests show the good electrochemical stability of the separator in a wide range of potential, as well as its outstanding cycle performance.

  14. High resolution photolithography using arrays of polystyrene and SiO2 micro- and nano-sized spherical lenses

    Science.gov (United States)

    Dvoretckaia, L. N.; Mozharov, A. M.; Mukhin, I. S.

    2017-11-01

    Photolithography mask made of close-packed array of micro- and nano-sized spherical lenses allows to obtain the ordered structures and provides highest “optical resolution/cost” ratio between all existing photolithography and laser direct writing methods. In this letter, we present results of modeling the propagation of a plane wave falling on the array of quartz (SiO2) microspherical lenses and focusing in the image reverse photoresist layer. We present here experimental results on fabrication of ordered arrays of submicron wells and columns and substrate preparation for growth of monocrystalline nanowires on metal surface using photolithography with mask of SiO2 microspheres. Such ordered nano-sized arrays of wells and columns can be used in fabrication of further growth of monocrystalline nanowires, quantum dots and production of plasmon structures.

  15. High-temperature mass spectrometric study of the vaporization processes and thermodynamic properties of samples in the Bi2O3-P2O5-SiO2system.

    Science.gov (United States)

    Vorozhtcov, Viktor A; Stolyarova, Valentina L; Lopatin, Sergey I; Shugurov, Sergey M; Shilov, Andrey L; Sapega, Vladimir F

    2017-01-15

    The Bi 2 O 3 -P 2 O 5 -SiO 2 system possesses a number of valuable properties that may be of use for various practical applications, both for obtaining new materials, e.g. optical fibers, and for replacing systems based on toxic lead silicate. Information on vaporization processes and thermodynamic properties obtained in the present study will be useful for the development of synthetic methods and approaches for modeling the thermodynamic properties of materials based on this system. High-temperature Knudsen effusion mass spectrometry was used to study the vaporization processes and to determine the thermodynamic properties of the components in the Bi 2 O 3 -P 2 O 5 -SiO 2 system. Measurements were performed with a MS-1301 magnetic sector mass spectrometer. Vaporization was carried out using an iridium-plated molybdenum twin effusion cell containing the sample under study and pure bismuth(III) oxide as a reference substance. Electron ionization at an energy of 30 eV was employed in the study. At a temperature of 950 K, Bi and O 2 were found to be the main vapor species over the samples studied. The Bi 2 O 3 activity as a function of composition in the Bi 2 O 3 -P 2 O 5 -SiO 2 system was derived from the obtained Bi partial pressures. The excess Gibbs energy of the system studied was calculated at 950 K and 1273 K. The possibility of using the Kohler method for the calculation of thermodynamic properties in the Bi 2 O 3 -P 2 O 5 -SiO 2 system was illustrated. The excess Gibbs energy of the Bi 2 O 3 -P 2 O 5 -SiO 2 system obtained in the present study using the Knudsen mass spectrometric method at 950 K and 1273 K demonstrated significant negative deviations from ideal behavior. The excess Gibbs energy values calculated by the Kohler method were shown to be in good agreement with those obtained from experimental data. Copyright © 2016 John Wiley & Sons, Ltd. Copyright © 2016 John Wiley & Sons, Ltd.

  16. Fabrication and characterization of TiO2/SiO2 based Bragg reflectors for light trapping applications

    Directory of Open Access Journals (Sweden)

    R.S. Dubey

    Full Text Available Distributed Bragg reflectors (DBRs have received an intensive attention due to their increasing demand in optoelectronic and photonic devices. Such reflectors are capable to prohibit the light propagation within the specified wavelength range of interest. In this paper, we present the fabrication of TiO2/SiO2 stacks based Bragg reflectors by using a simple and in-expensive sol-gel spin coating technique. The prepared single-layer thin films of TiO2 and SiO2 onto glass substrates were characterized for their optical constants. By tuning the process parameters, one-seven DBR stacks of TiO2/SiO2 were prepared. The corresponding shift of the Bragg reflection peak was observed with the increased number of DBR stacks and as much as about 90% reflectance is observed from the 7DBR stacks. The experimentally measured reflectance was compared with the simulated one, which showed good in agreement. FESEM measurement has confirmed the formation of bright and dark strips of TiO2 and SiO2 films with their thicknesses 80 and 115 nm respectively. The simulation study was explored to a design of thin film silicon solar cell using 7DBR stacks. An enhancement in light absorption in the visible wavelength range is observed which coincides with the experimental result of the reflectance. The use of DBR at the bottom of the solar cell could felicitate the better light harvesting with the occurrence of Fabry-Perot resonances in the absorbing layer. Keywords: Bragg reflector, Photonic bandgap, Sol-gel coating, Reflection, Absorption

  17. Fabrication and characterization of TiO2/SiO2 based Bragg reflectors for light trapping applications

    Science.gov (United States)

    Dubey, R. S.; Ganesan, V.

    Distributed Bragg reflectors (DBRs) have received an intensive attention due to their increasing demand in optoelectronic and photonic devices. Such reflectors are capable to prohibit the light propagation within the specified wavelength range of interest. In this paper, we present the fabrication of TiO2/SiO2 stacks based Bragg reflectors by using a simple and in-expensive sol-gel spin coating technique. The prepared single-layer thin films of TiO2 and SiO2 onto glass substrates were characterized for their optical constants. By tuning the process parameters, one-seven DBR stacks of TiO2/SiO2 were prepared. The corresponding shift of the Bragg reflection peak was observed with the increased number of DBR stacks and as much as about 90% reflectance is observed from the 7DBR stacks. The experimentally measured reflectance was compared with the simulated one, which showed good in agreement. FESEM measurement has confirmed the formation of bright and dark strips of TiO2 and SiO2 films with their thicknesses 80 and 115 nm respectively. The simulation study was explored to a design of thin film silicon solar cell using 7DBR stacks. An enhancement in light absorption in the visible wavelength range is observed which coincides with the experimental result of the reflectance. The use of DBR at the bottom of the solar cell could felicitate the better light harvesting with the occurrence of Fabry-Perot resonances in the absorbing layer.

  18. BF3.SiO2: an efficient catalyst for the synthesis of azo dyes at room temperature

    Directory of Open Access Journals (Sweden)

    Bi Bi Fatemeh Mirjalili

    2012-07-01

    Full Text Available A rapid one-pot method has been developed for the synthesis of azo dyes via ‎sequential diazotization–diazo coupling of aromatic amines with coupling agents at room ‎temperature in the presence of BF3.SiO2 as acidic catalyst. The obtained aryl diazonium salts bearing silica supported boron tri-flouride counter ion‎ was sufficiently stable to be kept at room ‎temperature in the dry state.‎

  19. Processing and properties of AA7075/ porous SiO2-MgO-Al2O3 composite

    OpenAIRE

    M.H. Robert; A.F. Jorge

    2012-01-01

    Purpose: the work presents a new composite based in Al matrix reinforced with porous, lightweight and low cost SiO2/MgO/Al2O3 ceramic particles. The new material can present a unique combination of properties: those related to metal/ceramic composites and still associating some characteristics of cellular materials, as the low density and high plastic deformation under compression stresses.Design/methodology/approach: processing technique involves the infiltration of AA7075 alloy in the semis...

  20. Magnetic properties of the SiO2(Co)/GaAs interface: Polarized neutron reflectometry and SQUID magnetometry

    Science.gov (United States)

    Ukleev, V. A.; Grigoryeva, N. A.; Dyadkina, E. A.; Vorobiev, A. A.; Lott, D.; Lutsev, L. V.; Stognij, A. I.; Novitskiy, N. N.; Mistonov, A. A.; Menzel, D.; Grigoriev, S. V.

    2012-10-01

    The effect of giant injection magnetoresistance (GIMR) was recently observed in a granular SiO2/(54-75 at. % Co) film on a semiconductor GaAs substrate in a temperature range near T=300 K. The magnetoresistance coefficient reaches a value of 105% in a magnetic field of 1.9 T and at a voltage of 90 V. A structural model of the film was proposed based on the results of the grazing-incidence small-angle scattering (GISAXS) and x-ray reflectivity, which showed a specific interface layer 70-75 Å thick separating bulk SiO2(Co) granular film from the semiconductor substrate. This layer is formed by a monolayer of flattened Co particles which are laterally spaced apart much further than the particles in the bulk film. In the present work, using polarized neutron reflectometry (PNR), we study both the structural and magnetic properties of SiO2(Co) film separately in the bulk and in the interface layer, which is possible due to the depth resolution of the method. Temperature-dependent PNR and magnetization measurements performed by Superconducting Quantum Interference Device (SQUID) revealed the occurrence of two types of magnetic nanoparticles with different blocking temperatures and magnetization. The magnetization hysteresis curve demonstrated specific two-loop structure in fields 0.5-2 T. Thus our self-consistent results of PNR, GISAXS, and SQUID measurements emphasize the role of the interface features in the SiO2(Co)/GaAs heterostructures and show a direction for further development of the GIMR theory.