Observation of reduction of secondary electron emission from helium ion impact due to plasma-generated nanostructured tungsten fuzz

International Nuclear Information System (INIS)

Hollmann, E M; Doerner, R P; Nishijima, D; Pigarov, A Yu

2017-01-01

Growth of nanostructured fuzz on a tungsten target in a helium plasma is found to cause a significant (∼3×) reduction in ion impact secondary electron emission in a linear plasma device. The ion impact secondary electron emission is separated from the electron impact secondary electron emission by varying the target bias voltage and fitting to expected contributions from electron impact, both thermal and non-thermal; with the non-thermal electron contribution being modeled using Monte-Carlo simulations. The observed (∼3×) reduction is similar in magnitude to the (∼2×) reduction observed in previous work for the effect of tungsten fuzz formation on secondary electron emission due to electron impact. It is hypothesized that the observed reduction results from re-absorption of secondary electrons in the tungsten fuzz. (paper)

Study of the secondary negative ion emission of copper and several of its alloys by impact with Cs/sup +/ ions

Energy Technology Data Exchange (ETDEWEB)

Vallerand, P; Baril, M [Laval Univ., Quebec City (Canada). Dept. de Physique

1977-07-01

Secondary ion emission studies have been undertaken using Cs/sup +/ as the primary ion beam. A good vacuum (ca. 10/sup -8/ torr) is needed to eliminate contamination by residual gases. Negative ion emission of pure copper is compared with its alloys. The thermodynamic equilibrium model of Andersen is discussed. For low element concentrations, the experimental data show enhancement in negative emission of P, Al, Fe, Sn, Ni, and attenuation for Zn, Pb. The order of magnitude of ionic efficiency S/sup -/ for copper is evaluated at 10/sup -4/.

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range

International Nuclear Information System (INIS)

Vidovic, Z.

1997-06-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Secondary emission from a CuBe target due to bombardment with parent and fragment ions of ammonia and phosphine

International Nuclear Information System (INIS)

Maerk, T.D.

1977-01-01

The secondary electron emission of the first dynode of a CuBe alloy sixteen dynode electron multiplier has been studied in the course of electron impact ionization studies of ammonia and phosphine. Relative secondary electron emission coefficients have been obtained for the singly and doubly charged parent and fragment ions of ammonia, ammonia-d 3 , phosphine and phosphine-d 3 for kinetic energies of 5,25 and 10,5 keV. It has been found, that in general deuterated ions have smaller γ coefficients, that ammonia ions have larger γ coefficients than corresponding phosphine ions, and that the γ coefficients increase with the complexity of the ion under study. (Auth.)

A novel ion imager for secondary ion mass spectrometry

International Nuclear Information System (INIS)

Matsumoto, Kazuya; Miyata, Kenji; Nakamura, Tsutomu

1993-01-01

This paper describes a new area detector for secondary ion mass spectrometry (SIMS) ion microscope, and its performance. The operational principle is based on detecting the change in potential of a floating photodiode caused by the ion-induced secondary-electron emission and the incoming ion itself. The experiments demonstrated that 10 1 -10 5 aluminum ions per pixel can be detected with good linear response. Moreover, relative ion sensitivities from hydrogen to lead were constant within a factor of 2. The performance of this area detector provides the potential for detection of kiloelectronvolt ion images with current ion microscopy

Characteristics of a wire ion plasma source and a secondary emission electron gun

International Nuclear Information System (INIS)

Hotta, Eiki; Osawa, Teruya; Urai, Hajime; Suzuki, Mitsuaki; Yasui, Hiroyuki; Tamagawa, Tohru

1993-01-01

Electrical characteristics of a wire ion plasma source (WIPS) and a secondary emission electron gun, for which the WIPS is used as an ion source, will be reported. The WIPS is a cold-cathode gaseous discharge device, in which a radial electron trapping permits an extremely low pressure gaseous discharge with very low applied voltages. The time evolutions of temperature and density of afterglow plasma were measured with a double probe. In the case of P 0 = 25 mTorr He and the maximum discharge current of 200 A, the temperature and density of electron were about 20 eV and of the order of 10 18 m -3 , respectively, just after the distinction of discharge. The ion current density measured by a biased ion collector (BIC) on the discharge tube wall was found to reach up to 300 mA/cm 2 . A secondary emission electron gun was set on the discharge tube wall opposite to the BIC. An earthed mesh net is installed at a height of 8 mm just in front of the cathode. The maximum negative bias voltage applied to the cathode is limited to -50 kV by the local breakdown in the gun, which occurred synchronously with the WIPS discharge. The electron beam current was measured by the BIC, in which an aluminum foil with a width of 2 μm was placed on instead of the earthed mesh net. At the cathode voltage of -30 kV, the measured beam current density was 220 mA/cm 2 . The extraporation of the resulted curve indicates that if the cathode voltage is -100 kV, the current density will reach to 1 A/cm 2 . The energy spectrum of the electron beam was measured with a magnetic energy analyzer, which was set in place of the BIC. The energy spread is about 300 eV at the central energy of 40 keV. Thus, they demonstrated the possibility of a high current density secondary emission electron gun, for which a WIPS is used as an ion source

Ionic secondary emission SIMS principles and instrumentation

International Nuclear Information System (INIS)

Darque-Ceretti, E.; Migeon, H.N.; Aucouturier, M.

1998-01-01

The ionic analysis by secondary emission (SIMS) is one of material analysis based on the ions bombardment. That is micro-analysis method in taking into account that the dimensions of the analysed volume are under the micrometer. This paper details in a first part some ionic secondary emission principle to introduce a description of the instrumentation: microprobe, ions production, spectrometers. (A.L.B.)

Secondary electron emission from Au by medium energy atomic and molecular ions

CERN Document Server

Itoh, A; Obata, F; Hamamoto, Y; Yogo, A

2002-01-01

Number distributions of secondary electrons emitted from a Au metal surface have been measured for atomic and molecular ions of H sup + , He sup + , C sup + , N sup + , O sup + , H sup + sub 2 , H sup + sub 3 , HeH sup + , CO sup + and O sup + sub 2 in the energy range 0.3-2.0 MeV. The emission statistics obtained are described fairly well by a Polya function. The Polya parameter b, determining the distribution shape, is found to decrease monotonously with increasing emission yield gamma, revealing a surprising relationship of b gamma approx 1 over the different projectile species and impact energies. This finding supports certainly the electron cascading model. Also we find a strong negative molecular effect for heavier molecular ions, showing a significant reduction of gamma compared to the estimated values using constituent atomic projectile data.

Emission of positive oxygen ions from ion bombardment of adsorbate-covered metal surfaces

International Nuclear Information System (INIS)

Kaurin, M.G.

1989-01-01

During ion bombardment of metal surfaces, collision cascades can result in the emission of sputtered secondary ions. Recent experiments, however, have suggested that the emission of positive ions of electronegative adsorbates can result from electronic processes rather than from processes involving elastic collisions. This dissertation presents the results of experiments studying the emission of positive oxygen ions from oxygen- and carbon-monoxide-covered transition metal surfaces during bombardment by 25-250 keV ions of neon, argon, and krypton. The systems studied may be grouped into four categories. For a nickel substrate with adsorbed oxygen, the emission of positive oxygen ions proceeds through collision cascades. For titanium and niobium with adsorbed oxygen, the emission of positive oxygen ions is proportional to the primary ion velocity, consistent with emission from electronic processes; for a given primary ion velocity, the oxygen ion yield is independent of primary ion species. For substrates of molybdenum and tungsten, the oxygen yield is proportional to primary ion velocity, but the yield also depends on the primary ion species for a given primary ion velocity in a manner that is consistent with emission resulting from electronic processes. For these two groups, except for titanium, the yields during neon ion bombardment do not extrapolate (assuming linearity with primary ion velocity) to a nonzero value at zero beam velocity. The magnitude of the oxygen ion yields from these targets is not consistent with that expected if the emission were induced by secondary electrons emitted during the ion bombardment

Secondary Electron Emission from Solid Hydrogen and Deuterium Resulting from Incidence of keV Electrons and Hydrogen Ions

DEFF Research Database (Denmark)

Sørensen, H.

1977-01-01

are small, in contrast to what is expected for insulating materials. One explanation is that the secondary electrons lose energy inside the target material by exciting vibrational and rotational states of the molecules, so that the number of electrons that may escape as secondary electrons is rather small....... The losses to molecular states will be largest for hydrogen, so that the SEE coefficients are smallest for solid hydrogen, as was observed. For the incidence of ions, the values of δ for the different molecular ions agree when the number of secondary electrons per incident atom is plotted versus the velocity...... or the stopping power of the incident particles. Measurements were also made for oblique incidence of H+ ions on solid deuterium for angles of incidence up to 75°. A correction could be made for the emission of secondary ions by also measuring the current calorimetrically. At largest energies, the angular...

Analysis of As implantation profiles in silica by nuclear microanalysis and secondary ion emission

International Nuclear Information System (INIS)

Dieumegard, D.; Croset, M.; Cohen, C.; Lhoir, A.; Rigo, S.; Chaumont, J.

1974-01-01

Results obtained from analysis using, either the method of elastic backscattering of light or semi-heavy ions ( 4 He + , 14 N + ) about one MeV energy, or the secondary ion emission method are compared. The choice of As implanted Si is explained by the following reasons: As is an element relatively heavy in comparison with Si, that allows an analysis to be effected on a few thousands Angstroems depth in silica using elastic backscattering; the silica chosen as substrate being an amorphous material allows channeling phenomena to the avoided during implantation and analysis [fr

Enhancement of the secondary ion emission from Si by O/sub 2 and H/sub 2/O adsorption

International Nuclear Information System (INIS)

Huan, C.H.; Wee, A.T.S.; Tan, K.L.

1992-01-01

The positive and negative secondary ion emission of Si are examined as a function of O/sub 2 and H/sub 2/O surface coverage under conditions of simultaneous adsorption and Ar/sup+ ion bombardment. It is found that the ion-molecule mechanism accounts for the adsorbate-induced signals and that yield enhancement by H/sub 2/O adsorption is less effective than O/sub 2 adsorption. (authors)

Comparison of secondary ion emission induced in silicon oxide by MeV and KeV ion bombardment

International Nuclear Information System (INIS)

Allali, H.; Nsouli, B.; Thomas, J.P.; Szymczak, W.; Wittmaack, K.

1993-09-01

The surface and near-surface composition of SiO 2 layers, has been investigated by negative secondary ion emission mass spectrometry (SIMS) using MeV and KeV ion bombardment in combination with time-of-flight (TOF) mass analysis. The spectra recorded in the mass range 0-100 u are dominated by surface impurities, notably hydrocarbons and silicon polyanions incorporating H and OH entities. The characteristic (fragmentation) patterns are quite different for light and high-velocity ion impact. In high-velocity TOF-SIMS analysis of P-doped layers, prepared by chemical vapour deposition (CVD), the mass lines at 63 and 79 u are very prominent and appear to correlate with the phosphorus concentration (PO 2 and PO 3 , respectively). It is shown, however, that for unambiguous P analysis one has to use dynamic SIMS or high mass resolution. (author) 11 refs., 5 figs

Highly charged ion based time-of-flight emission microscope

International Nuclear Information System (INIS)

Hamza, Alex V.; Barnes, Alan V.; Magee, Ed; Newman, Mike; Schenkel, Thomas; McDonald, Joseph W.; Schneider, Dieter H.

2000-01-01

An emission microscope using highly charged ions as the excitation source has been designed, constructed, and operated. A novel ''acorn'' objective lens has been used to simultaneously image electron and secondary ion emission. A resistive anode-position sensitive detector is used to determine the x-y position and time of arrival of the secondary events at the microscope image plane. Contrast in the image can be based on the intensity of the electron emission and/or the presence of particular secondary ions. Spatial resolution of better than 1 μm and mass resolution m/Δm of better than 400 were demonstrated. Background rejection from uncorrelated events of greater than an order of magnitude is also achieved. (c) 2000 American Institute of Physics

Study of secondary electron emission from thin carbon targets with swift charged particles: heavy ions, hydrogen ions; Etude experimentale de l`emission electronique secondaire de cibles minces de carbone sous l`impact de projectiles rapides: ions lourds, ions hydrogene (atomiques, moleculaires ou sous forme d`agregats)

Energy Technology Data Exchange (ETDEWEB)

Billebaud, A

1995-07-12

The main subject of this work is the study of electron emission from the two surfaces of thin solid targets bombarded with swift charged particles. The slowing down of swift ions in matter is mainly due to inelastic interaction with target electrons (ionization, excitation): the energy transfer to target electrons is responsible for the secondary electron emission process. The phenomenological and theoretical descriptions of this phenomena are the subject of the first chapter. We focused on secondary electron emission induced by different kind of projectiles on thin carbon foils. In chapter two we describe hydrogen cluster induced electron emission measurement between 40 and 120 keV/proton. These projectiles, composed of several atoms, allowed us to study and highlight collective effects of the electron emission process. We extended our study of electron emission to molecular (H{sub 2}{sup +}, H{sub 3}{sup +}) and composite (H{sup -}, H{sup 0}) projectiles at higher energies (<= 2 MeV): we have designed an experimental set-up devoted to electron emission statistics measurements which allowed us to study, among others things, the role of projectile electrons in secondary electron emission. This experiment is described in the third chapter. Finally, the fourth chapter describes new measurements of electron emission induced by energetic (13 MeV/u) and highly charged argon ion provided by the medium energy beam line (SME) of GANIL (Caen), which have been analyzed in the framework of a semi-empirical model of secondary electron emission. This set of experiments brings new results on composite projectile interaction with matter, and on the consequences of high energy deposition in solids. (author).

Ranges, Reflection and Secondary Electron Emission for keV Hydrogen Ions Incident on Solid N2

DEFF Research Database (Denmark)

Børgesen, P.; Sørensen, H.; Hao-Ming, Chen

1983-01-01

Ranges were measured for 0.67–3.3 keV/amu hydrogen and deuterium ions in solid N2. Comparisons with similar results for N2-gas confirm the previously observed large phase effect in the stopping cross section. Measurements of the secondary electron emission coefficient for bulk solid N2 bombarded...... by 0.67–9 keV/amu ions also seem to support such a phase effect. It is argued that we may also extract information about the charge state of reflected projectiles....

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

Directory of Open Access Journals (Sweden)

G. Fubiani

2008-01-01

Full Text Available The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses. The resulting secondary particles (positive ions, neutrals, and electrons are accelerated and deflected by the electric and magnetic fields inside the accelerator and may induce more secondaries after a likely impact with the accelerator grids. This chain of reactions is responsible for a non-negligible heat load on the grids and must be understood in detail. In this paper, we will provide a comprehensive summary of the physics involved in the process of secondary emission in a typical ITER-like negative ion electrostatic accelerator together with a precise description of the numerical method and approximations involved. As an example, the multiaperture-multigrid accelerator concept will be discussed.

Temperature and energy effects on secondary electron emission from SiC ceramics induced by Xe17+ ions.

Science.gov (United States)

Zeng, Lixia; Zhou, Xianming; Cheng, Rui; Wang, Xing; Ren, Jieru; Lei, Yu; Ma, Lidong; Zhao, Yongtao; Zhang, Xiaoan; Xu, Zhongfeng

2017-07-25

Secondary electron emission yield from the surface of SiC ceramics induced by Xe 17+ ions has been measured as a function of target temperature and incident energy. In the temperature range of 463-659 K, the total yield gradually decreases with increasing target temperature. The decrease is about 57% for 3.2 MeV Xe 17+ impact, and about 62% for 4.0 MeV Xe 17+ impact, which is much larger than the decrease observed previously for ion impact at low charged states. The yield dependence on the temperature is discussed in terms of work function, because both kinetic electron emission and potential electron emission are influenced by work function. In addition, our experimental data show that the total electron yield gradually increases with the kinetic energy of projectile, when the target is at a constant temperature higher than room temperature. This result can be explained by electronic stopping power which plays an important role in kinetic electron emission.

Ion induced high energy electron emission from copper

International Nuclear Information System (INIS)

Ruano, G.; Ferron, J.

2008-01-01

We present measurements of secondary electron emission from Cu induced by low energy bombardment (1-5 keV) of noble gas (He + , Ne + and Ar + ) and Li + ions. We identify different potential and kinetic mechanisms and find the presence of high energetic secondary electrons for a couple of ion-target combinations. In order to understand the presence of these fast electrons we need to consider the Fermi shuttle mechanism and the different ion neutralization efficiencies.

Secondary emission ion analyzer provided with an electron gun for insulating material analysis

International Nuclear Information System (INIS)

Blanchard, Bruno; Carrier, Patrick; Marguerite, J.-L.; Rocco, J.-C.

1976-01-01

This invention relates to a secondary emission ion analyser, fitted with an electron gun. It is used in the mass spectrometry analysis of electrically insulating bodies. It has already been suggested to bombard the target with an electron beam in conjunction with the beam of primary particles, in order to reduce the space charge near the target. The object of this invention is the application of this known process to appliances of the ion analyser type with a high electric field near the target. Its main characteristic is the use of an electron gun emitting an electron beam through the extraction lens placed opposite the target. The extraction electric field influences the path of the electrons but the electric and mechanical specifications of the electron gun in the invention are such that the target is correctly sprayed by the electron beam [fr

Ion induced high energy electron emission from copper

Energy Technology Data Exchange (ETDEWEB)

Ruano, G. [Instituto de Desarrollo Tecnologico para la Industria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina)], E-mail: gdruano@ceride.gov.ar; Ferron, J. [Instituto de Desarrollo Tecnologico para la Industria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina); Departamento de Ingenieria de Materiales, Facultad de Ingenieria Quimica, Consejo Nacional de Investigaciones Cientificas y Tecnicas and Universidad Nacional del Litoral Gueemes 3450 CC 91, 3000 Santa Fe (Argentina)

2008-11-15

We present measurements of secondary electron emission from Cu induced by low energy bombardment (1-5 keV) of noble gas (He{sup +}, Ne{sup +} and Ar{sup +}) and Li{sup +} ions. We identify different potential and kinetic mechanisms and find the presence of high energetic secondary electrons for a couple of ion-target combinations. In order to understand the presence of these fast electrons we need to consider the Fermi shuttle mechanism and the different ion neutralization efficiencies.

Surface behavior based on ion-induced secondary electron emission from semi-insulating materials in breakdown evolution

Energy Technology Data Exchange (ETDEWEB)

Koc, Emrah; Karakoese, Sema [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Salamov, Bahtiyar G. [Department of Physics, Faculty of Sciences, Gazi University, 06500 Ankara (Turkey); Institute of Physics, National Academy of Science, 1143 Baku (Azerbaijan)

2013-09-15

This study focuses on analyses of secondary electron emission (SEE) at semiconductor surfaces when the sufficient conditions of space-time distribution occur. Experimental measurements and calculations with the approach of Townsend coefficients, which include the evaluations of ionization coefficient ({alpha}) and SEE coefficient ({gamma}) were performed in high-ohmic InP, GaAs, and Si semiconductor cathodes with argon and air environments in a wide range of E/N (300-10 000 Td). The direct calculations of {gamma} were carried out to determine the behavior of cold-semiconductor cathode current in a wide range of microgaps (45-525 {mu}m). Paschen curves are interpreted in the dependence of large pd range on breakdown voltage through {gamma} and {alpha}/N. Ion-induced secondary electrons exhibit the direct behaviors affecting the timescale of breakdown evolution in the vicinity of the Paschen minimum during the natural bombardment process with ions of semiconductor cathodes. Also, when {alpha}/N rapidly drops and the excitations of gas atoms densely occupy the gas volume, we determined that the photoelectric effect provides a growth for electron emission from semiconductor surfaces at the breakdown stage at the reduced values of E/N. At all pressures, the emission magnitudes of electrons liberated by semiconductor cathodes into vacuum are found as {gamma}{sub InP} > {gamma}{sub GaAs} > {gamma}{sub Si} in breakdown evolution. (copyright 2013 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

Secondary ion mass spectroscopy (SIMS)

International Nuclear Information System (INIS)

Naik, P.K.

1975-01-01

Secondary Ion Mass Spectrometry (SIMS) which is primarily a method for investigating the chemical composition of the uppermost atomic layer of solid surfaces is explained. In this method, the specimen is bombarded with a primary positive ion beam of small current density monolayer. Positive and negative ions sputtered from the specimen are mass analysed to give the surface chemical composition. The analytical system which consists of a primary ion source, a target manipulator and a mass spectrometer housed in an ultrahigh vacuum system is described. This method can also be used for profile measurements in thin films by using higher current densities of the primary ions. Fields of application such as surface reactions, semiconductors, thin films emission processes, chemistry, metallurgy are touched upon. Various aspects of this method such as the sputtering process, instrumentation, and applications are discussed. (K.B.)

Secondary ion emission from cleaned surfaces bombarded by 100 MeV accelerator beams at the GSI Darmstadt

International Nuclear Information System (INIS)

Wien, K.; Becker, O.; Guthier, W.; Knippelberg, W.; Koczon, P.

1988-01-01

The 1.4 MeV/n beam facility for the UNILAC/GSI has been used to study secondary ion emission from surfaces cleaned under UHV conditions by ion etching or cleaving of crystals. The desorption phenomena observed by means of TOF mass spectrometry can be classified as follows: (1) Clean metal surfaces emit metal ions being ejected by atomic collisions cascades. Electronic excitation of surface states seems to support ionization. (2) The desorption of contaminants adsorbed at the metal surface is strongly correlated with the electronic energy loss of the projectiles - even, if the content of impurities is very low. (3) Ion formation at the epitaxial surface of fluoride crystals as CaF 2 , MgF 2 and NaF is initiated by the electronic excitation of the crystal. At high beam energies the mass spectrum is dominated by a series of cluster ions. These cluster ions disappear below a certain energy deposit threshold, whereas small atomic ions are observed over the whole energy range

Wave packet study of the secondary emission of negatively charged, monoatomic ions from sputtered metals

Energy Technology Data Exchange (ETDEWEB)

Sindona, A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy) and Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)]. E-mail: sindona@fis.unical.it; Riccardi, P. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Maletta, S. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Rudi, S.A. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy); Falcone, G. [Dipartimento di Fisica, Universita della Calabria, Via P. Bucci 31C, 87036 Rende (Italy); Istituto Nazionale di Fisica Nucleare (INFN), Gruppo collegato di Cosenza, Via P. Bucci 31C, 87036 Rende (Italy)

2007-05-15

Secondary emission of Ag{sup -} and Au{sup -} particles, following the sputtering of clean Ag(1 0 0) and Au(1 0 0) targets, respectively, is studied with a Crank-Nicholson wave-packet propagation method. A one-electron pseudo-potential is used to describe the plane metal surface, with a projected band gap, the ejected ion, whose charge state is investigated, and its nearest-neighbor substrate ion, put in motion by the collision cascade generated by the primary ion beam. Time-dependent Schroedinger equation is solved backwards in time to determine the evolution of the affinity orbital of the negative particles from an instant when they are unperturbed, at distances of the order of {approx}10{sup 2} a.u. from the surface, to the instant of ejection. The probability that a band electron will be eventually detected in affinity state of the ejected particle is, thus, calculated and compared with the result of another method based on the spectral decomposition of the one-electron Hamiltonian.

Helium ion beam induced electron emission from insulating silicon nitride films under charging conditions

Science.gov (United States)

Petrov, Yu. V.; Anikeva, A. E.; Vyvenko, O. F.

2018-06-01

Secondary electron emission from thin silicon nitride films of different thicknesses on silicon excited by helium ions with energies from 15 to 35 keV was investigated in the helium ion microscope. Secondary electron yield measured with Everhart-Thornley detector decreased with the irradiation time because of the charging of insulating films tending to zero or reaching a non-zero value for relatively thick or thin films, respectively. The finiteness of secondary electron yield value, which was found to be proportional to electronic energy losses of the helium ion in silicon substrate, can be explained by the electron emission excited from the substrate by the helium ions. The method of measurement of secondary electron energy distribution from insulators was suggested, and secondary electron energy distribution from silicon nitride was obtained.

Fragment ion and electron emission from C sub 6 sub 0 by fast heavy ion impact

CERN Document Server

Mizuno, T; Itoh, A; Tsuchida, H; Nakai, Y

2003-01-01

Correlation between electron emission and fragmentation of C sub 6 sub 0 was studied using 847keV Si sup + ions. Mass distribution of fragment ions, number distribution of secondary electrons, and final charge distribution of outgoing projectiles were successfully measured by means of a triple coincidence time-of-flight method. Strong correlation was observed for electron emission and fragmentation.

A new approach to nuclear microscopy: The ion-electron emission microscope

International Nuclear Information System (INIS)

Doyle, B.L.; Vizkelethy, G.; Walsh, D.S.; Senftinger, B.; Mellon, M.

1998-01-01

A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam does not have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Science.gov (United States)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-01

Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An ;equivalent work function; is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called ;work function; (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Ion-induced secondary electron emission, optical and hydration resistant behavior of MgO, Mg–Mo–O and Mg–Ce–O thin films

International Nuclear Information System (INIS)

Kumar, Ashok; Thota, Subhash; Deva, Dinesh; Kumar, Jitendra

2014-01-01

Optical transmittance, hydration resistance and secondary electron emission characteristics of e-beam evaporated pure and Mo- or Ce-containing MgO thin films have been investigated. While the increased grain size and pyramidal columnar morphology following incorporation of molybdenum and cerium in MgO are responsible for the excellent discharge characteristics, emergence of neutral {100} and {110} MgO surfaces preferentially give rise to high optical transmittance (∼ 92–100%) and stability against hydration. Further, addition of Mo (or Ce) in MgO causes significant increase in defect density which, in turn, enhances the photoluminescence (PL) emission from 5-, 4- and 3-coordination sites. The changes lead to lowering of the breakdown voltage and hence improvement in the secondary electron emission (SEE) efficiency. These facts have been supported by ion-induced SEE yield (γ) deduced from the a.c. breakdown voltage observed, taking neon as a discharge gas, and determined semi-empirically as well with Hagstrum's theory based on Auger neutralization process using (i) band offset parameters and surface band gap data derived from X-ray photoelectron spectroscopy signal and (ii) information of defect energy levels obtained from photoluminescence (PL) measurements. The experimental values of neon ion-induced SEE yield (γ) are found to be 0.35, 0.42 and 0.39 for MgO, Mg–Mo–O (x = 0.035) and Mg–Ce–O (x = 0.01) thin films, respectively. - Highlights: • Higher hydration resistance • Increased photoluminescence emission • Higher secondary electron emission

Ion cyclotron emission by spontaneous emission

Energy Technology Data Exchange (ETDEWEB)

Da Costa, O [Commission of the European Communities, Abingdon (United Kingdom). JET Joint Undertaking; Gresillon, D [Ecole Polytechnique, 91 - Palaiseau (France). Lab. de Physique des Milieux Ionises

1994-07-01

The goal of the study is to examine whether the spontaneous emission can account for ICE (ion cyclotron emission) experimental results, or part of them. A straightforward approach to plasma emission is chosen, investigating the near equilibrium wave radiation by gyrating ions, and thus building from the majority and fast fusion ions the plasma fluctuations and emission on the fast magnetoacoustic or compressional Alfven wave mode in the IC frequency range. Similarities with the ICE experiments are shown: the emission temperature in the presence of fast ions (even in a very small amount), the strong fast ion emission increase with the harmonic, the fine double-line splitting of each peak, the linear but not proportional increase of the peak width with the harmonic. 3 refs., 2 figs.

Ion cyclotron emission by spontaneous emission

International Nuclear Information System (INIS)

Da Costa, O.; Gresillon, D.

1994-01-01

The goal of the study is to examine whether the spontaneous emission can account for ICE (ion cyclotron emission) experimental results, or part of them. A straightforward approach to plasma emission is chosen, investigating the near equilibrium wave radiation by gyrating ions, and thus building from the majority and fast fusion ions the plasma fluctuations and emission on the fast magnetoacoustic or compressional Alfven wave mode in the IC frequency range. Similarities with the ICE experiments are shown: the emission temperature in the presence of fast ions (even in a very small amount), the strong fast ion emission increase with the harmonic, the fine double-line splitting of each peak, the linear but not proportional increase of the peak width with the harmonic. 3 refs., 2 figs

Jean’s instability in a complex plasma in presence of secondary electrons and nonthermal ions

International Nuclear Information System (INIS)

Sarkar, Susmita; Maity Saumyen

2013-01-01

In this paper we have investigated the effect of secondary electron emission and nonthermality of ion velocity distribution simultaneously on Jean’s instability in a complex plasma in presence of negatively charged dust grains. Primary and secondary electron temperatures are assumed to be equal. Thus plasma under consideration consists of Boltzmann distributed electrons, nonthermal ions and negatively charged dust grains. The dust grain component is modeled by continuity and momentum equations. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically it is found that for lower values of the nonthermal parameter Jean’s instability is higher for higher secondary electron emission whereas the effect of secondary electron emission on Jean’s instability becomes insignificant for higher values of the nonthermal parameter. (author)

Discussion of the origin of secondary photon and secondary ion emission during energetic particle irradiation of solids. I. The collision cascade

International Nuclear Information System (INIS)

Wright, R.B.; Gruen, D.M.

1980-01-01

Secondary photon and secondary ion emission during energetic particle irradiation of solid surfaces is assumed to arise due to excitation and de-excitation of sputtered particles originating from a collision cascade induced by the incident projectile. The excitation is postulated to occur by two alternative mechanisms: path (a), where excitation occurs at or very near the surface of the solid due to atom--atom or atom--electron collisions; and path (b), where excitation occurs as the sputtered particle leaves the solid, but is still under its influence so that electron exchange processes are permitted. Once the excited and/or ionized sputtered particle is formed nonradiative de-excitation processes are then included in the discussion which allow the excited and/or ionized particle to be de-excited and/or neutralized. The result of these nonradiative de-excitation processes is shown to provide a possible channel for the formation of new excited ''daughters'' by the de-excitation of the initial excited ''parent''. Depending on the initial excitation probability of the parent the new excited daughters are shown to contribute to various energy regions of the excited and/or ionized secondary particle energy distribution. A mathematical formalism is developed based on the neutral sputtered atom energy and velocity distributions assuming a collision cascade origin for these sputtered particles. By including various models for the excitation probability, and the survival probability for excited particles once formed to not undergo nonradiative de-excitation the resulting energy and velocity distributions of the sputtered excited and/or ionized secondary particles are calculated. These distributions are found to be a function of the emission angle depending on the model assumed for the initial excitation. From this formalism the total excited secondary particle yield may be calculated

Experimental study on the secondary emission (atomic and molecular ions, aggregates, electrons) induced by the bombardment of surfaces by means of energetic heavy ions (∼ MeV/u). Effects of the charge state of the projectiles

International Nuclear Information System (INIS)

Monart, B.

1988-05-01

The ionic and electronic emissions, induced by the sputtering of solid targets (organic and inorganic) with 1 MeV/u projectiles. The time-of-flight spectrometry is applied to the secondary emission analysis. The projectile velocity, the angle of attack (between the beam and the target), and the projectile's incident charge state, are taken into account. It is shown that the secondary emission depends on the charge of the incident ion and on the charge state changement in the material's bulk. A model, applying the theoretical calculations concerning the charge in the material's bulk, is proposed. The existence of an interaction depth, for the incident ion and the material, which depends on the secondary ions type and on the incident ion charge, is suggested. The calculated depth is about 200 angstroms for the aggregates ejected from a CsI target, sputtered with 14 Kr 18+ . The H + yield (coming from ∼ 10 angstroms) is used as a projectile charge probe, at the material surface. The experimental method allows, for the first time, the obtention of the equilibrium charge state in the condensed matter. The same method is applied to determine the non-equilibrium charges in the bulk of thin materials. The results show that, after leaving the material, the projectile presents a post-ionization state [fr

Secondary electrons as probe of preequilibrium stopping power of ions penetrating solids

International Nuclear Information System (INIS)

Kroneberger, K.; Rothard, H.; Koschar, P.; Lorenzen, P.; Groeneveld, K.O.; Clouvas, A.; Veje, E.; Kemmler, J.

1990-01-01

The passage of ions through solid media is accompanied by the emission of low energy secondary electrons. At high ion velocities v p (i.e. v p > 10 7 cm/s) the kinetic emission of electrons as a result of direct Coulomb interaction between the ion and the target electron is the dominant initial production mechanism. The energy lost by the ion and, thus, transferred to the electrons is known as electronic stopping power in the solid. Elastic and inelastic interactions of primary, liberated electrons on their way through the bulk and the surface of the solid modify strongly their original energy and angular distribution and, in particular, leads to the transfer of their energy to further, i.e. secondary electrons (SE), such that the main part of the deposited energy of the ion is eventually over transferred to SE. It is, therefore, suggestive to assume a proportionality between the electronic stopping power S sm-bullet of the ion and the total SE yield g, i.e. the number of electrons ejected per ion. Following Sternglass the authors consider schematically for kinetic SE emission contributions from two extreme cases: (a) SEs produced mostly isotropically with large impact parameter, associated with an escape depth L SE from the solid; (b) SEs produced mostly unisotropically in forward direction with small impact parameter (δ-electrons), associated with a transport length L δ

Secondary electron emission in nanostructured porous silicon

Energy Technology Data Exchange (ETDEWEB)

Ruano, G D; Ferron, J; Koropecki, R R, E-mail: gdruano@ceride.gov.a [INTEC-UNL-CONICET, Gueemes 3450 - 3000 Santa Fe (Argentina)

2009-05-01

We studied the reversible reduction induced by ion bombardment of the secondary electron emission (SEE) yield. This effect has been modelled as due to changes in dynamically sustained dipoles related with ions and electrons penetration ranges. Such charge configuration precludes the escape of electrons from the nanoporous silicon, making the SEE dependent on the flux of impinging ions. Since this dipolar momentum depends on the electric conduction of the porous medium, by controlled oxidation of the nanoporous structure we change the conduction features of the sample, studying the impact on the SEE reduction effect. Li ion bombardment was also used with the intention of changing the parameters determining the effect. FT-IR and Auger electron spectroscopy were used to characterize the oxidation degree of the samples at different depth scales

Investigations on Cu-Ni and Cu-Al systems with secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Rodriguez-Murcia, H.; Beske, H.E.

1976-04-01

The ratio of the ionization coefficients of secondary atomic ions emitted from the two component systems Cu-Ni and Cu-Al was investigated as a function of the concentration of the two components. In the low concentration range the ratio of the ionization coefficients is a constant. An influence of the phase composition on the ratio of the ionization coefficients was found in the Cu-Al system. In addition, the cluster ion emission was investigated as a function of the concentration and the phase composition of the samples. The secondary atomic ion intensity was influenced by the presence of cluster ions. The importance of the cluster ions in quantitative analysis and phase determination by means of secondary ion mass spectrometry are discussed. (orig.) [de

Spontaneous radiation emission during penetration of ions in solids

International Nuclear Information System (INIS)

Miraglia, J.E.; Pacher, M.C.

1988-01-01

In this work, the principal continuum radiative emission processes, which occur during the penetration of ions in solids or gases, are resumed. The characteristics of the following processes are discussed: secondary electron bremsstrahlung (SEB), atomic bremsstrahlung (AB), and internuclear bremsstrahlung (INB). Recent advances of the ion channeling effects in crystal solids on the spontaneous radiative spectra are exposed. (A.C.A.S.) [pt

Secondary electron/reflected particle coincidence studies during slow highly charged ion-surface interactions

Energy Technology Data Exchange (ETDEWEB)

McGrath, C.T.; Szilagyi, Z.; Shah, M.B.; McCullough, R.W. [Queen' s Univ., Belfast, Northern Ireland (United Kingdom); Woolsey, J.M. [Stirling Univ. (United Kingdom). DBMS; Trassl, R.; Salzborn, E. [Giessen Univ. (Germany). Inst. fuer Kernphysik

2001-07-01

We have measured the secondary electron emission statistics (ES) for 5 keV N{sup q+} (q = 1-4) ions incident at 10 on polycrystalline aluminium, in coincidence with specularly reflected N{sup 0}. In this arrangement the kinetic contribution to secondary electron emission is minimised. The experimental data shows that the coincident electron yield, {gamma}, increases linearly with incident ion charge state. The kinetic emission contribution has also been determined from this data. The ES due to 2 and 4 keV He{sup 2+} impact on polycrystalline aluminium in coincidence with specularly reflected He{sup +} and He{sup 0} have also been determined. The process He{sup 2+} {yields} He{sup 0} yields a larger {gamma} value than the process He{sup 2+} {yields} He{sup +}. (orig.)

Measurement of secondary particle production induced by particle therapy ion beams impinging on a PMMA target

Directory of Open Access Journals (Sweden)

Toppi M.

2016-01-01

Full Text Available Particle therapy is a technique that uses accelerated charged ions for cancer treatment and combines a high irradiation precision with a high biological effectiveness in killing tumor cells [1]. Informations about the secondary particles emitted in the interaction of an ion beam with the patient during a treatment can be of great interest in order to monitor the dose deposition. For this purpose an experiment at the HIT (Heidelberg Ion-Beam Therapy Center beam facility has been performed in order to measure fluxes and emission profiles of secondary particles produced in the interaction of therapeutic beams with a PMMA target. In this contribution some preliminary results about the emission profiles and the energy spectra of the detected secondaries will be presented.

Cs+ ion source for secondary ion mass spectrometry

International Nuclear Information System (INIS)

Bentz, B.L.; Weiss, H.; Liebl, H.

1981-12-01

Various types of cesium ionization sources currently used in secondary ion mass spectrometry are briefly reviewed, followed by a description of the design and performance of a novel, thermal surface ionization Cs + source developed in this laboratory. The source was evaluated for secondary ion mass spectrometry applications using the COALA ion microprobe mass analyzer. (orig.)

Secondary electron emission from 0.5--2.5-MeV protons and deuterons

International Nuclear Information System (INIS)

Thornton, T.A.; Anno, J.N.

1977-01-01

Measurement of the secondary electron currents leaving Al, V, Fe, 316 stainless steel, Nb, and Mo foils undergoing 0.5--2.5-MeV proton and deuteron bombardment were made to determine the secondary electron emission ratios for these ions. The measured secondary electron yields were of the order of 1.0, with the deuterons producing generally higher yields than the protons

A novel electrostatic ion-energy spectrometer by the use of a proposed ``self-collection'' method for secondary-electron emission from a metal collector

Science.gov (United States)

Hirata, M.; Nagashima, S.; Cho, T.; Kohagura, J.; Yoshida, M.; Ito, H.; Numakura, T.; Minami, R.; Kondoh, T.; Nakashima, Y.; Yatsu, K.; Miyoshi, S.

2003-03-01

For the purpose of end-loss-ion energy analyses in open-field plasmas, a newly developed electrostatic ion-energy spectrometer is proposed on the basis of a "self-collection" principle for secondary-electron emission from a metal collector. The ion-energy spectrometer is designed with multiple grids for analyzing incident ion energies, and a set of parallelly placed metal plates with respect to lines of ambient magnetic forces in an open-ended device. One of the most important characteristic properties of this spectrometer is the use of our proposed principle of a "self-collection" mechanism due to E×B drifts for secondary electrons emitted from the grounded metal-plate collector by the use of no further additional magnetic systems except the ambient open-ended fields B. The proof-of-principle and characterization experiments are carried out by the use of a test-ion-beam line along with an additional use of a Helmholtz coil system for the formation of open magnetic fields similar to those in the GAMMA 10 end region. The applications of the developed ion-energy spectrometer for end-loss-ion diagnostics in the GAMMA 10 plasma experiments are demonstrated under the conditions with simultaneous incidence of energetic electrons produced by electron-cyclotron heatings for end-loss-plugging potential formation, since these electrons have contributed to disturb these ion signals from conventional end-loss-ion detectors.

Modeling secondary electron emission from nanostructured materials in helium ion microscope

International Nuclear Information System (INIS)

Ohya, K.; Yamanaka, T.

2013-01-01

Charging of a SiO 2 layer on a Si substrate during helium (He) beam irradiation is investigated at an energy range relevant to a He ion microscope (HIM). A self-consistent calculation is performed to model the transport of the ions and secondary electrons (SEs), the charge accumulation in the layer, and the electric field below and above the surface. The calculated results are compared with those for gallium (Ga) ions at the same energy and 1 keV electrons corresponding to a low-voltage scanning electron microscope (SEM). The charging of thin layers ( 2 step formed on a Si substrate, a sharp increase in the number of SEs is observed, irrespective of whether a material is charged or not. When the He ions are incident on the bottom of the step, the re-entrance of SEs emitted from the substrate into the sidewall is clearly observed, but it causes the sidewall to be charged negatively. At the positions on the SiO 2 layer away from the step edge, the charging voltage becomes positive with increasing number of Ga ions and electrons. However, He ions do not induce such a voltage due to strong relaxation of positive and negative charges in the Si substrate and their recombination in the SiO 2 layer

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams

NARCIS (Netherlands)

Castaldo, V.; Withagen, J.; Hagen, C.; Kruit, P.; Van Veldhoven, E.

2011-01-01

In recent years, novel ion sources have been designed and developed that have enabled focused ion beam machines to go beyond their use as nano-fabrication tools. Secondary electrons are usually taken to form images, for their yield is high and strongly dependent on the surface characteristics, in

Investigation of argon ion sputtering on the secondary electron emission from gold samples

Energy Technology Data Exchange (ETDEWEB)

Yang, Jing; Cui, Wanzhao, E-mail: cuiwanzhao@126.com; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-09-30

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Investigation of argon ion sputtering on the secondary electron emission from gold samples

International Nuclear Information System (INIS)

Yang, Jing; Cui, Wanzhao; Li, Yun; Xie, Guibai; Zhang, Na; Wang, Rui; Hu, Tiancun; Zhang, Hongtai

2016-01-01

Highlights: • An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. • After sputtering, A decrease of δmax and an increase of E1 were observed with increasing Eion. • Further sputtering at higher energies broaden the SE spectra, and the equivalent work function, ϕ, increase considerably to 12.6 eV. - Abstract: Secondary electron (SE) yield, δ, is a very sensitive surface property. The values of δ often are not consistent for even identical materials. The influence of surface changes on the SE yield was investigated experimentally in this article. Argon ion sputtering was used to remove the contamination from the surface. Surface composition was monitored by X-ray photoelectron spectroscopy (XPS) and surface topography was scanned by scanning electron microscope (SEM) and atomic force microscope (AFM) before and after every sputtering. It was found that argon sputtering can remove contamination and roughen the surface. An “equivalent work function” is presented in this thesis to establish the relationship between SE yield and surface properties. Argon ion sputtering of 1.5keV leads to a significant increase of so called “work function” (from 3.7 eV to 6.0 eV), and a decrease of SE yield (from 2.01 to 1.54). These results provided a new insight into the influence of surface changes on the SE emission.

Doubly Charged Ion Emission in Sputtering of Monocrystalline Fluorides

Czech Academy of Sciences Publication Activity Database

Lörinčík, Jan; Šroubek, Zdeněk

2002-01-01

Roč. 187, - (2002), s. 447-450 ISSN 0168-583X R&D Projects: GA ČR GA202/99/0881; GA AV ČR IAA1067801 Institutional research plan: CEZ:AV0Z4040901 Keywords : secondary ion emission * doubly charged * sputtering Subject RIV: CF - Physical ; Theoretical Chemistry Impact factor: 1.158, year: 2002

Direct and Recoil-Induced Electron Emission from Ion-Bombarded Solids

DEFF Research Database (Denmark)

Holmen, G.; Svensson, B.; Schou, Jørgen

1979-01-01

The kinetic emission of secondary electrons from ion-bombarded solid surfaces is split into two contributions, a direct one caused by ionizing collisions between the bombarding ion and target atoms, and an indirect one originating from ionizing collisions undergone by recoil atoms with other target...... atoms. The direct contribution, which has been treated by several authors in previous studies, shows a behavior that is determined primarily by the electronic stopping power of the bombarding ion, while the indirect contribution is nonproportionally related to the nuclear stopping power. This latter...

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Ion emission microscope microanalyzer

International Nuclear Information System (INIS)

Cherepin, V.T.; Olckovsky, V.L.

1977-01-01

In the ion microanalyzer (microprobe) the object is exposed to the bombardment of a highly focused ion beam, the secondary ions emitted from the object being analyzed by means of a mass filter. In order to be able to control the position of an analysis synchronous to the local analysis of an object an ion-optical converter (electron image with a fluorescent screen) is placed behind the aperture diaphragm in the direction of the secondary ion beam. The converter allows to make visible in front of the mass filter a non-split ion image characterizing the surface of the surface investigated. Then a certain section may be selected for performing chemical and isotope analyses. (DG) [de

On Secondary Electron Emission from Solid H2 and D2

DEFF Research Database (Denmark)

Schou, Jørgen; Sørensen, H.

1978-01-01

The emission of secondary electrons from solid hydrogen (H2 , D2, T2) is often considered to be of importance for the interaction between a fusion plasma and pellets of solid hydrogens. A set-up was therefore built for studies of interactions between energetic particles and solid hydrogens. Studies...... of secondary electron emission (SEE) from solid H2 and D2 were made for incidence of electrons up to 3 keV and for incidence of ions of hydrogen, deuterium, and helium up to 10 keV. The measurements were made for normal incidence, and in some cases also for oblique incidence. The SEE coefficients for solid H2...... is always 0.65-0.70 times that for solid D2. This difference is attributed to different losses to vibrational states in H2 and D2 for the low energy electrons. Measurements were also made on solid para-H2 with both electrons and hydrogen ions. There was no difference from the results for normal H2, which...

Non-invasive monitoring of therapeutic carbon ion beams in a homogeneous phantom by tracking of secondary ions

Science.gov (United States)

Gwosch, K.; Hartmann, B.; Jakubek, J.; Granja, C.; Soukup, P.; Jäkel, O.; Martišíková, M.

2013-06-01

Radiotherapy with narrow scanned carbon ion beams enables a highly accurate treatment of tumours while sparing the surrounding healthy tissue. Changes in the patient’s geometry can alter the actual ion range in tissue and result in unfavourable changes in the dose distribution. Consequently, it is desired to verify the actual beam delivery within the patient. Real-time and non-invasive measurement methods are preferable. Currently, the only technically feasible method to monitor the delivered dose distribution within the patient is based on tissue activation measurements by means of positron emission tomography (PET). An alternative monitoring method based on tracking of prompt secondary ions leaving a patient irradiated with carbon ion beams has been previously suggested. It is expected to help in overcoming the limitations of the PET-based technique like physiological washout of the beam induced activity, low signal and to allow for real-time measurements. In this paper, measurements of secondary charged particle tracks around a head-sized homogeneous PMMA phantom irradiated with pencil-like carbon ion beams are presented. The investigated energies and beam widths are within the therapeutically used range. The aim of the study is to deduce properties of the primary beam from the distribution of the secondary charged particles. Experiments were performed at the Heidelberg Ion Beam Therapy Center, Germany. The directions of secondary charged particles emerging from the PMMA phantom were measured using an arrangement of two parallel pixelated silicon detectors (Timepix). The distribution of the registered particle tracks was analysed to deduce its dependence on clinically important beam parameters: beam range, width and position. Distinct dependencies of the secondary particle tracks on the properties of the primary carbon ion beam were observed. In the particular experimental set-up used, beam range differences of 1.3 mm were detectable. In addition, variations

Secondary electron emission of thin carbon foils under the impact of hydrogen atoms, ions and molecular ions, under energies within the MeV range; Multiplicite des electrons secondaires emis par des cibles minces de carbone sous l'impact de projectiles H0, H2+, H3+ d'energie de l'ordre du MeV

Energy Technology Data Exchange (ETDEWEB)

Vidovic, Z

1997-06-15

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H{sup 0}, H{sub 2}{sup +} and H{sub 3}{sup +} projectiles in the 0.25-2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. The phenomenological and theoretical descriptions, as well as a summary of the main theoretical models are the subject of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of a thin carbon foil traversed by an energetic projectile is described in the chapter two. In this chapter are also presented the method and algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with the emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H{sub 2}{sup +} and H{sub 3}{sup +} polyatomic ions. The results are interpreted in terms of collective effects in the interactions of these ions with solids. The role of the proximity of the protons, molecular ion fragments, upon the amplitude of these collective effects is evidenced from the study of the statistics of forward emission. These experiences allowed us to shed light on various aspects of atom and polyatomic ion inter-actions with solid surfaces. (author)

Simulation study of radial dose due to the irradiation of a swift heavy ion aiming to advance the treatment planning system for heavy particle cancer therapy: The effect of emission angles of secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Moribayashi, Kengo, E-mail: moribayashi.kengo@jaea.go.jp

2015-12-15

A radial dose simulation model has been proposed in order to advance the treatment planning system for heavy particle cancer therapy. Here, the radial dose is the dose due to the irradiation of a heavy ion as a function of distances from this ion path. The model proposed here may overcome weak points of paradigms that are employed to produce the conventional radial dose distributions. To provide the radial dose with higher accuracy, this paper has discussed the relationship between the emission angles of secondary electrons and the radial dose. It is found that the effect of emission angles becomes stronger on the radial dose with increasing energies of the secondary electrons.

Secondary electron emission from textured surfaces

Science.gov (United States)

Huerta, C. E.; Patino, M. I.; Wirz, R. E.

2018-04-01

In this work, a Monte Carlo model is used to investigate electron induced secondary electron emission for varying effects of complex surfaces by using simple geometric constructs. Geometries used in the model include: vertical fibers for velvet-like surfaces, tapered pillars for carpet-like surfaces, and a cage-like configuration of interlaced horizontal and vertical fibers for nano-structured fuzz. The model accurately captures the secondary electron emission yield dependence on incidence angle. The model shows that unlike other structured surfaces previously studied, tungsten fuzz exhibits secondary electron emission yield that is independent of primary electron incidence angle, due to the prevalence of horizontally-oriented fibers in the fuzz geometry. This is confirmed with new data presented herein of the secondary electron emission yield of tungsten fuzz at incidence angles from 0-60°.

Secondary electron emission from insulators

International Nuclear Information System (INIS)

Kanaya, K.; Ono, S.; Ishigaki, F.

1978-01-01

The high yield of secondary electron emission from insulators due to electron bombardment may be the result of an increase of the depth of escape. The free-electron scattering theory is applied to the high energy of primary beams, but cannot be applied to the low energy of secondary escaping beams because of the large energy gap of the insulators. The plasmon loss with the valence electron is considered when the secondary electrons escape. Based on the energy retardation power formula of the penetration and energy loss of an electron probe into solid targets, secondary electron emissions from insulators are calculated from the assumptions that the distribution of the secondary electrons due to both incident and back-scattered electrons within the target is isotropic and that it follows the absorption law of the Lenard type. The universal yield-energy curve of the secondary electron emission, which is deduced as a function of three parameters such as ionisation potential, valence electron and the back-scattered coefficient in addition to the free-electron density effect, is found to be in good agreement with the experimental results. (author)

Modified Sternglass theory for the emission of secondary electrons by fast-electron impact

International Nuclear Information System (INIS)

Suszcynsky, D.M.; Borovsky, J.E.

1992-01-01

The Sternglass theory [Sternglass, Phys. Rev. 108, 1 (1957)] for fast-ion-induced secondary-electron emission from metals has been modified to predict the secondary-electron yield from metals impacted by energetic (several keV to about 200 keV) electrons. The primary modification of the theory accounts for the contribution of the backscattered electrons to the production of secondary electrons based on a knowledge of the backscattered-electron energy distribution. The modified theory is in reasonable agreement with recent experimental data from gold targets in the 6--30-keV electron energy range

Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS

International Nuclear Information System (INIS)

Scharager, C.; Stuck, R.; Siffert, P.; Cailleret, J.; Heitz, Ch.; Lagarde, G.; Tenorio, D.

1979-01-01

The possibilities of using both selective heavy ion induced X-ray emission and secondary ion mass spectroscopy (SIMS), for the identification of impurities present at low concentrations in cadmium telluride are examined. The relative concentrations of the impurities along CdTe crystals have been determined by exciting the X-ray emission of the elements in several slices with Ar and Kr ions and by comparing the relative characteristic X-ray emission yields. As a consequence of the quasimolecular inner shell ionization mechanism in heavy ion-atom collisions, Ar and Kr ions allow a strong excitation of the main impurities seen by SIMS namely Si, Cl and Ge, As, with only a minor contribution of Cd and Te. From the changes of the concentrations of the various impurities along the crystal, informations about segregation coefficients and compensation can be obtained

Bi-Directional Ion Emission from Massive Gold Cluster Impacts on Nanometric Carbon Foils

OpenAIRE

DeBord, J. Daniel; Della-Negra, Serge; Fernandez-Lima, Francisco A.; Verkhoturov, Stanislav V.; Schweikert, Emile A.

2012-01-01

Carbon cluster emission from thin carbon foils (5–40 nm) impacted by individual Aun+q cluster projectiles (95–125 qkeV, n/q = 3–200) reveals features regarding the energy deposition, projectile range, and projectile fate in matter as a function of the projectile characteristics. For the first time, the secondary ion emission from thin foils has been monitored simultaneously in both forward and backward emission directions. The projectile range and depth of emission were examined as a function...

Monte Carlo simulation of kinetic electron emission from metal due to impact of heavy ions

International Nuclear Information System (INIS)

Kawata, J.; Ohya, K.

1999-01-01

A Monte Carlo simulation is performed for study of the dependence of kinetic electron emission on nuclear charge of projectile Z 1 , using the nonlinear response theory with the density-functional (DF) formalism to calculate electron excitation cross section. The kinetic yield, energy distribution, excitation depth distribution and emission statistics of emitted electrons showed clear Z 1 oscillations, however, the Z 1 oscillations of them are different from that of the inelastic stopping power, in particular for high Z 1 , due to large elastic energy loss of the ions and secondary cascade process of primary excited electrons within the solid. For high Z 1 , the linear relationship does not exist between them and the inelastic stopping power, although they are closely related to it. The emission of high-energy primary electrons excited by the ion within shallow depth without experiencing the secondary cascade process, results in the Z 1 dependence in the energy distribution, excitation depth distribution and emission statistics of emitted electrons

Effect of Weakly Nonthermal Ion Velocity Distribution on Jeans Instability in a Complex Plasma in Presence of Secondary Electrons

International Nuclear Information System (INIS)

Sarkar, S.; Maity, S.

2013-01-01

In this paper we have investigated the effect of weak nonthermality of ion velocity distribution on Jean’s instability in a complex plasma in presence of secondary electrons and negatively charged dust grains. The primary and secondary electron temperatures are assumed equal. Thus plasma under consideration consists of three components: Boltzman distributed electrons, non-thermal ions and negatively charged inertial dust grains. From the linear dispersion relation we have calculated the real frequency and growth rate of the Jean’s mode. Numerically we have found that secondary electron emission destabilizes Jean’s mode when ion nonthermality is weak. (author)

The future of the SIRAD SEE facility Ion-Electron Emission Microscopy

CERN Document Server

Wyss, J; Kaminski, A; Magalini, A; Nigro, M; Pantano, D; Sedhykh, S

2002-01-01

The SIRAD facility is dedicated to radiation damage studies on semiconductor detectors, electronic devices and systems, using proton and ion beams delivered by a 15 MV tandem accelerator. It is routinely used by groups involved in detector development for elementary particle physics, electronic device physics and space applications. In particular, Single Event Effect studies are very important to the latter two activities. Presently, the facility can only characterize the global sensitivity of a device or system to single ion impacts. To map out the sensitivity of a device with micrometric resolution, following an idea developed at SANDIA, we will implement an Ion-Electron Emission Microscope (IEEM) to reconstruct the X,Y and time coordinates of an impacting energetic ion by imaging the secondary electrons emitted by the sample using a standard emission electron microscope and position sensitive detector system. After describing typical Single Event Effect activities at SIRAD we will discuss the basic princip...

The practical model of electron emission in the radioisotope battery by fast ions

International Nuclear Information System (INIS)

Erokhine, N.S.; Balebanov, V.M.

2003-01-01

Under the theoretical analysis of secondary-emission radioisotope source of current the estimate of energy spectrum F(E) of secondary electrons with energy E emitted from films is the important problem. This characteristic knowledge allows, in particular, studying the volt-ampere function, the dependence of electric power deposited in the load on the system parameters and so on. Since the rigorous calculations of energy spectrum F(E) are the complicated enough and labour-intensive there is necessity to elaborate the practical model which allows by the simple computer routine on the basis of generalized data (both experimental measurements and theoretical calculations) on the stopping powers and mean free path of suprathermal electrons to perform reliable express-estimates of the energy spectrum F(E) and the volt-ampere function I(V) for the concrete materials of battery emitter films. This paper devoted to description of of the practical model to calculate electron emission characteristics under the passage of fast ion fluxes from the radioisotope source through the battery emitter. The analytical approximations for the stopping power of emitter materials, the electron inelastic mean free path, the ion production of fast electrons and the probability for them to arrive the film surface are taken into account. In the cases of copper and gold films, the secondary electron escaping depth, the position of energy spectrum peak are considered in the dependence on surface potential barrier magnitude U. According to our calculations the energy spectrum peak shifted to higher electron energy under the U growth. The model described may be used for express estimates and computer simulations of fast alpha-particles and suprathermal electrons interactions with the solid state plasma of battery emitter films, to study the electron emission layer characteristics including the secondary electron escaping depth, to find the optimum conditions for excitation of nonequilibrium

Surface characterization by energy distribution measurements of secondary electrons and of ion-induced electrons

International Nuclear Information System (INIS)

Bauer, H.E.; Seiler, H.

1988-01-01

Instruments for surface microanalysis (e.g. scanning electron or ion microprobes, emission electron or ion microscopes) use the current of emitted secondary electrons or of emitted ion-induced electrons for imaging of the analysed surface. These currents, integrating over all energies of the emitted low energy electrons, are however, not well suited to surface analytical purposes. On the contrary, the energy distribution of these electrons is extremely surface-sensitive with respect to shape, size, width, most probable energy, and cut-off energy. The energy distribution measurements were performed with a cylindrical mirror analyser and converted into N(E), if necessary. Presented are energy spectra of electrons released by electrons and argon ions of some contaminated and sputter cleaned metals, the change of the secondary electron energy distribution from oxidized aluminium to clean aluminium, and the change of the cut-off energy due to work function change of oxidized aluminium, and of a silver layer on a platinum sample. The energy distribution of the secondary electrons often shows detailed structures, probably due to low-energy Auger electrons, and is broader than the energy distribution of ion-induced electrons of the same object point. (author)

Doubly charged ion emission in sputtering of monocrystalline fluorides

Czech Academy of Sciences Publication Activity Database

Lörinčík, Jan; Šroubek, Zdeněk

2002-01-01

Roč. 187, č. 4 (2002), s. 447-450 ISSN 0168-583X. [Atomic Collisions in Solids ICACS /19./. Paris, 29.07.2001-03.08.2001] R&D Projects: GA AV ČR IAA1067801; GA ČR GA202/99/0881 Institutional research plan: CEZ:AV0Z2067918 Keywords : sputtering * molecular electronic states * secondary ion emission Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.158, year: 2002

Shielding data for hadron-therapy ion accelerators: Attenuation of secondary radiation in concrete

CERN Document Server

Agosteo, S; Sagia, E; Silari, M

2014-01-01

The secondary radiation field produced by seven different ion species (from hydrogen to nitrogen), impinging onto thick targets made of either iron or ICRU tissue, was simulated with the FLUKA Monte Carlo code, and transported through thick concrete shields: the ambient dose equivalent was estimated and shielding parameters evaluated. The energy for each ion beam was set in order to reach a maximum penetration in ICRU tissue of 290 mm (equivalent to the therapeutic range of 430 MeV/amu carbon ions). Source terms and attenuation lengths are given as a function of emission angle and ion species, along with fits to the Monte Carlo data, for shallow depth and deep penetration in the shield. Trends of source terms and attenuation lengths as a function of neutron emission angle and ion species impinging on tar- get are discussed. A comparison of double differential distributions of neutrons with results from similar simulation works reported in the literature is also included. The aim of this work is to provide shi...

Effect of velocity variation on secondary-ion-emission probability: Quantum stationary approach

International Nuclear Information System (INIS)

Goldberg, E.C.; Ferron, J.; Passeggi, M.C.G.

1989-01-01

The ion-velocity dependence of the ionization probability for an atom ejected from a surface is examined by using a quantum approach in which the coupled motion between electrons and the outgoing nucleus is followed along the whole trajectory by solving the stationary Schroedinger equation. We choose a very-small-cluster-model system in which the motion of the atom is restricted to one dimension, and with energy potential curves corresponding to the involved channels varying appreciably with the atom position. We found an exponential dependence on the inverse of the asymptotic ion velocity for high emission energies, and a smoother behavior with slight oscillations at low energies. These results are compared with those obtained within a dynamical-trajectory approximation using either a constant velocity equal to the asymptotic ionic value, or expressions for the velocity derived from the eikonal approximation and from the classical limit of the current vector. Both approaches give similar results provided the velocity is allowed to adjust self-consistently to potential energies and transition-amplitude variations. Strong oscillations are observed in the low-emission-energy range either if the transitions are neglected, or a constant velocity along the whole path is assumed for the ejected particle

Comment on the effect of Cs on photon and secondary ion emission during sputtering

International Nuclear Information System (INIS)

Yu, M.L.

1978-01-01

The effect of Cs on photon and negative ion emission was discussed for the situations where the sputtered atom interacts either very weakly or very strongly with the target surface. The experimental data seem to favor the strong interaction case. 5 references

Ionizing device comprising a microchannel electron multiplier with secondary electron emission

International Nuclear Information System (INIS)

Chalmeton, Vincent.

1974-01-01

The present invention relates to a ionizing device comprising a microchannel electron multiplier involving secondary electron emission as a means of ionization. A system of electrodes is used to accelerate said electrons, ionize the gas and extract the ions from thus created plasma. Said ionizer is suitable for bombarding the target in neutron sources (target of the type of nickel molybdenum coated with tritiated titanium or with a tritium deuterium mixture) [fr

Secondary emission scintillation counter for microdosimetry at the nanometer level

International Nuclear Information System (INIS)

Goldhagen, P.

1987-01-01

The secondary emission scintillation (SES) counter is a device designed to count the positive ions of charged-particle tracks in gas volumes simulating sites in tissue with diameters of the order of 1 nanometer. Based on suggestions by H.H. Rossi and A.M. Kellerer, the basic idea of the device was developed by A. Kosiara, M. Biavati, and R.D. Colvett in the late 1970s. The device was substantially modified in 1982, but work on it was suspended before the new version could be tested, in order to devote full-time effort to rebuilding RARAF. Work resumed on the SES counter in 1986. A diagram of the prototype SES counter now being tested is shown. A weak electric field in the cylindrical collection region of the device drifts ions from a track to a small region (less than 1 mm) of high electric field where they are accelerated by several kilovolts onto a dynode, producing secondary electrons. The secondary electrons are then accelerated onto a plastic scintillator, and the resulting light is detected by a photomultiplier. The passage of a charged particle is established by a solid state detector, which triggers electronics detecting coincidences and measuring the timing and amplitude of pulses from the photomultiplier

Secondary ion shadow-cone enhanced desorption

Energy Technology Data Exchange (ETDEWEB)

Chechen Chang (Hawaii Univ., Honolulu (USA). Dept. of Chemistry)

1990-02-01

The incident angle dependence of the secondary particle emission process under keV ion bombardment has been investigated. The results from the full molecular dynamics calculations indicate that the flux anisotropy of the incident beam, resulting from the non-uniform impact parameters for the surface atom of a single crystal, affects the particle desorption in a systematic fashion. The enhanced desorption at certain angles of incidence corresponds to the intensive focusing of the incident beam to the near-surface atom and the extended dissipation of momentum by large-angle scattering. This observation has let us to develop a new theoretical model in which the enhanced desorption is described by the distance of closest encounter along the trajectory of the incident particle to the surface atom. The computer time for the simulation of the incident-angle-dependent emission process is significantly reduced. The results from the calculation based on this model are in good agreement both with the results from the full dynamics calculation and with the experimental results. The new model also allows a complementary evaluation of the microscopic dynamics involved in the shadow-cone enhanced desorption. (author).

Time-of-flight secondary-ion mass spectrometry on thiole self-assembly monolayers on gold; Flugzeit-Sekundaerionenmassenspektrometrie an Thiol self assembly Monolagen auf Gold

Energy Technology Data Exchange (ETDEWEB)

Schroeder, M.

2006-07-01

Aim of this thesis was to get a deeper understanding for the influence of different matrix effects on the emission of molecular secondary ions. For the estimation of the influence of the primary-ion surface interaction a series of different primary-ion species was applied, which differ by mass, kinetic energy, and composition (monoatomic or polyatomic). In the framework of the presented results different matrix effects were studied. For this systematically the influence of the substrate-thiolate, the thiolate-thiolate, and the primary-ion substrate interaction on the formation of characteristic secondary ions was quantified. For the corresponding considerations beside the thiolate secondary ions M{sup -} the gold-thiolate clusters of the type Au{sub x+1}M{sub x}{sup -} were referred to.

Secondary electron emission from solid HD and a solid H2-D2 mixture

DEFF Research Database (Denmark)

Sørensen, H.; Børgesen, P.; Hao-Ming, Chen

1983-01-01

Secondary electron emission from solid HD and a solid 0.6 H2 + 0.4 D2 mixture has been studied for electron and hydrogen ion bombardment at primary energies from 0.5 to 3 keV and 2 to 10 keV/amu, respectively. The yield for solid HD is well explained by a simple stoichiometric model of the low...

Secondary ion emission from metal surfaces bombarded by 0.5-10 keV protons and hydrogens

International Nuclear Information System (INIS)

Kitamura, Akira; Yano, Syukuro

1978-01-01

Secondary ion emission coefficients by bombardment of 0.5 - 10 keV protons K 11 and atomic hydrogens K 01 on copper, stainless steel, molybdenum and evaporated gold surfaces have been measured in a moderate vacuum. Results are summarized as follows; 1) There is no significant difference between K 11 and K 01 . 2) Differences in K 11 and K 11 between different samples of the same material and between the sample before baking-out and the same sample after baking-out are of the order of several tens of percent. 3) The incident particle energy E sub(max) at which K 11 and K 01 have the maximum value lies in the keV region, and increases with the target mass. According to the fact that E sub(max) differs substantially from the energy at which the elastic stopping power has the maximum value, a characteristic length l is introduced and calculated to be of the order of hundreds of A; the factor exp (-x/l) represents the degree of contribution of collision at depth x to K 11 or K 01 . (author)

Effect of secondary electron emission on subnanosecond breakdown in high-voltage pulse discharge

Science.gov (United States)

Schweigert, I. V.; Alexandrov, A. L.; Gugin, P.; Lavrukhin, M.; Bokhan, P. A.; Zakrevsky, Dm E.

2017-11-01

The subnanosecond breakdown in open discharge may be applied for producing superfast high power switches. Such fast breakdown in high-voltage pulse discharge in helium was explored both in experiment and in kinetic simulations. The kinetic model of electron avalanche development was developed using PIC-MCC technique. The model simulates motion of electrons, ions and fast helium atoms, appearing due to ions scattering. It was shown that the mechanism responsible for ultra-fast breakdown development is the electron emission from cathode. The photoemission and emission by ions or fast atoms impact is the main reason of current growth at the early stage of breakdown, but at the final stage, when the voltage on discharge gap drops, the secondary electron emission (SEE) is responsible for subnanosecond time scale of current growth. It was also found that the characteristic time of the current growth τS depends on the SEE yield of the cathode material. Three types of cathode material (titanium, SiC, and CuAlMg-alloy) were tested. It is shown that in discharge with SiC and CuAlMg-alloy cathodes (which have enhanced SEE) the current can increase with a subnanosecond characteristic time as small as τS = 0.4 ns, for the pulse voltage amplitude of 5- 12 kV..

Field-emission liquid-metal ion source and triode ion gun

International Nuclear Information System (INIS)

Komuro, M.; Kawakatsu, H.

1981-01-01

A pointed-filament-type field-emission liquid-metal ion source is designed and employed as a gold ion source. By adding a crossbar across a hairpin bend, the amount of the gold adhering on the filament is increased. The lifetime is estimated to be over 200 h at 10-mA emission current. The emission current increases with increasing extraction voltage up to a saturation value which is ascribed to a limitation of the supply of liquid gold to the needle apex. The value of current density per unit solid angle is 30 mA/sr at a total current of 30 mA, which is of the same order as that obtained from a gallium ion source previously reported. Emission current fluctuations of a few tens of percent of the dc component are observed. In order to regulate the emission current and suppress current fluctuations, a bias electrode in addition to a counterelectrode is placed close to the needle apex. With such a triode structure, the emission current is regulated by a bias voltage of several hundred volts and stabilized to within 1% by means of feedback to the bias voltage of a current monitor output

Cooperative emission in ion implanted Yb:YAG waveguides

Energy Technology Data Exchange (ETDEWEB)

Vazquez, G V; Desirena, H; De la Rosa, E [Centro de Investigaciones en Optica, Loma del Bosque 115, Lomas del Campestre, 37150 Leon, Guanajuato (Mexico); Flores-Romero, E; Rickards, J; Trejo-Luna, R [Instituto de Fisica, UNAM, Apartado Postal 20364, 01000 Mexico, D. F. (Mexico); Marquez, H, E-mail: gvvazquez@cio.mx [Departamento de Optica, CICESE, Km 107 Carr. Tijuana-Ensenada, 22860 Ensenada, B. C. (Mexico)

2011-01-01

In this work, we report the analysis of spectroscopic properties of waveguides fabricated by ion implantation in YAG doped with Yb{sup 3+} ions. Three emission bands were detected in the blue, green and red regions under 970-nm excitation. The strong blue-green emission can be explained by a cooperative process between ytterbium ion pairs, leading to emission centered at 514 nm. The additional blue bands as well as green and red emission bands are attributed to the presence of Tm{sup 3+} and Er{sup 3+} traces. The results include absorption and emission curves as well as decay time rates.

Cooperative emission in ion implanted Yb:YAG waveguides

International Nuclear Information System (INIS)

Vazquez, G V; Desirena, H; De la Rosa, E; Flores-Romero, E; Rickards, J; Trejo-Luna, R; Marquez, H

2011-01-01

In this work, we report the analysis of spectroscopic properties of waveguides fabricated by ion implantation in YAG doped with Yb 3+ ions. Three emission bands were detected in the blue, green and red regions under 970-nm excitation. The strong blue-green emission can be explained by a cooperative process between ytterbium ion pairs, leading to emission centered at 514 nm. The additional blue bands as well as green and red emission bands are attributed to the presence of Tm 3+ and Er 3+ traces. The results include absorption and emission curves as well as decay time rates.

Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging.

Science.gov (United States)

Kiss, András; Smith, Donald F; Jungmann, Julia H; Heeren, Ron M A

2013-12-30

Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high-speed imaging of biomolecules from complex surfaces. Technological developments such as new position-sensitive detectors, in combination with polyatomic primary ion sources, are required to exploit the full potential of microscope mode mass spectrometry imaging, i.e. to efficiently push the limits of ultra-high spatial resolution, sample throughput and sensitivity. In this work, a C60 primary source was combined with a commercial mass microscope for microscope mode secondary ion mass spectrometry imaging. The detector setup is a pixelated detector from the Medipix/Timepix family with high-voltage post-acceleration capabilities. The system's mass spectral and imaging performance is tested with various benchmark samples and thin tissue sections. The high secondary ion yield (with respect to 'traditional' monatomic primary ion sources) of the C60 primary ion source and the increased sensitivity of the high voltage detector setup improve microscope mode secondary ion mass spectrometry imaging. The analysis time and the signal-to-noise ratio are improved compared with other microscope mode imaging systems, all at high spatial resolution. We have demonstrated the unique capabilities of a C60 ion microscope with a Timepix detector for high spatial resolution microscope mode secondary ion mass spectrometry imaging. Copyright © 2013 John Wiley & Sons, Ltd.

Mass spectrum of secondary ions knocked-out from copper surface by argon ion beam

International Nuclear Information System (INIS)

Koval', A.G.; Bobkov, V.V.; Klimovskij, Yu.A.; Fogel', Ya.M.

1976-01-01

The mass-spectrum of secondary ions was studied within a mass range of 1-400. The ions were knocked-out by the beam of ions Ar + from the copper surface with different content of oxygen and sulphur solved in the volume. The studies were conducted at three temperatures of the target. The atomic and molecular ions of the metal matrix, volumetric impurities of metal and ions of chemical compounds molecules of the metal under study with gas particles adsorbed on its surface and atoms of the metal volumetric admixtures may be observed in the mass spectrum. Detection of secondary ions of the copper multi-atomic complexes and ions of these complexes compounds with the adsorbed molecules is of interest

SU-D-BRB-02: Investigations of Secondary Ion Distributions in Carbon Ion Therapy Using the Timepix Detector.

Science.gov (United States)

Gwosch, K; Hartmann, B; Jakubek, J; Granja, C; Soukup, P; Jaekel, O; Martisikova, M

2012-06-01

Due to the high conformity of carbon ion therapy, unpredictable changes in the patient's geometry or deviations from the planned beam properties can result in changes of the dose distribution. PET has been used successfully to monitor the actual dose distribution in the patient. However, it suffers from biological washout processes and low detection efficiency. The purpose of this contribution is to investigate the potential of beam monitoring by detection of prompt secondary ions emerging from a homogeneous phantom, simulating a patient's head. Measurements were performed at the Heidelberg Ion-Beam Therapy Center (Germany) using a carbon ion pencil beam irradiated on a cylindrical PMMA phantom (16cm diameter). For registration of the secondary ions, the Timepix detector was used. This pixelated silicon detector allows position-resolved measurements of individual ions (256×256 pixels, 55μm pitch). To track the secondary ions we used several parallel detectors (3D voxel detector). For monitoring of the beam in the phantom, we analyzed the directional distribution of the registered ions. This distribution shows a clear dependence on the initial beam energy, width and position. Detectable were range differences of 1.7mm, as well as vertical and horizontal shifts of the beam position by 1mm. To estimate the clinical potential of this method, we measured the yield of secondary ions emerging from the phantom for a beam energy of 226MeV/u. The differential distribution of secondary ions as a function of the angle from the beam axis for angles between 0 and 90° will be presented. In this setup the total yield in the forward hemisphere was found to be in the order of 10 -1 secondary ions per primary carbon ion. The presented measurements show that tracking of secondary ions provides a promising method for non-invasive monitoring of ion beam parameters for clinical relevant carbon ion fluences. Research with the pixel detectors was carried out in frame of the Medipix

Invention of Lithium Ion Secondary Battery and Its Business Development

OpenAIRE

正本, 順三/米田,晴幸; 米田, 晴幸; MASAMOTO, Junzo; YONEDA, Haruyuki

2010-01-01

At present, mobile phones and laptop computers are essential items in our daily life. As a battery for such portable devices, the lithium ion secondary battery is used. The lithium ion secondary battery, which is used as a battery for such portable devices, was first invented by Dr. Yoshino at Asahi Kasei. In this paper, the authors describe how the lithium ion secondary battery was developed by the inventor. The authors also describe the battery separator, which is one of the key components ...

Secondary emissions during fiber laser cutting of nuclear material

Energy Technology Data Exchange (ETDEWEB)

Lopez, A., E-mail: beatriz.mendes.lopez@gmail.com [IDMEC, Instituto Superior Técnico, Universidade de Lisboa, Lisboa (Portugal); Assunção, E. [IDMEC, Instituto Superior Técnico, Universidade de Lisboa, Lisboa (Portugal); European Federation for Welding, Joining and Cutting, Porto Salvo 2740-120 (Portugal); Pires, I. [IDMEC, Instituto Superior Técnico, Universidade de Lisboa, Lisboa (Portugal); Quintino, L. [IDMEC, Instituto Superior Técnico, Universidade de Lisboa, Lisboa (Portugal); European Federation for Welding, Joining and Cutting, Porto Salvo 2740-120 (Portugal)

2017-04-15

The laser process has been studied for dismantling work for more than 10 years, however there is almost no data available concerning secondary emissions generated during the process. These emissions are inevitable during the laser cutting process and can have detrimental effects in human health and in the equipment. In terms of safety, for nuclear decommissioning, is crucial to point out ways of controlling the emissions of the process. This paper gives indications about the parameters to be used in order to reduce these secondary emissions and about the influence of these parameters on the particles size distribution. In general, for producing minimal dross and fume emissions the beam focus should be placed on the surface of the material. The higher percentage of secondary emissions which present higher diameter, increases approximately linearly with the stand-off distance and with the use of low air pressure.

Simulation of secondary emission calorimeter for future colliders

Science.gov (United States)

Yetkin, E. A.; Yetkin, T.; Ozok, F.; Iren, E.; Erduran, M. N.

2018-03-01

We present updated results from a simulation study of a conceptual sampling electromagnetic calorimeter based on secondary electron emission process. We implemented the secondary electron emission process in Geant4 as a user physics list and produced the energy spectrum and yield of secondary electrons. The energy resolution of the SEE calorimeter was σ/E = (41%) GeV1/2/√E and the response linearity to electromagnetic showers was to within 1.5%. The simulation results were also compared with a traditional scintillator calorimeter.

Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma

Directory of Open Access Journals (Sweden)

Torrisi Lorenzo

2018-01-01

Full Text Available The pulsed laser-generated plasma in vacuum and at low and high intensities can be characterized using different physical diagnostics. The charge particles emission can be characterized using magnetic, electric and magnet-electrical spectrometers. Such on-line techniques are often based on time-of-flight (TOF measurements. A 90° electric deflection system is employed as ion energy analyzer (IEA acting as a filter of the mass-to-charge ratio of emitted ions towards a secondary electron multiplier. It determines the ion energy and charge state distributions. The measure of the ion and electron currents as a function of the mass-to-charge ratio can be also determined by a magnetic deflector spectrometer, using a magnetic field of the order of 0.35 T, orthogonal to the ion incident direction, and an array of little ion collectors (IC at different angles. A Thomson parabola spectrometer, employing gaf-chromix as detector, permits to be employed for ion mass, energy and charge state recognition. Mass quadrupole spectrometry, based on radiofrequency electric field oscillations, can be employed to characterize the plasma ion emission. Measurements performed on plasma produced by different lasers, irradiation conditions and targets are presented and discussed. Complementary measurements, based on mass and optical spectroscopy, semiconductor detectors, fast CCD camera and Langmuir probes are also employed for the full plasma characterization. Simulation programs, such as SRIM, SREM, and COMSOL are employed for the charge particle recognition.

Magnetic and electric deflector spectrometers for ion emission analysis from laser generated plasma

Science.gov (United States)

Torrisi, Lorenzo; Costa, Giuseppe; Ceccio, Giovanni; Cannavò, Antonino; Restuccia, Nancy; Cutroneo, Mariapompea

2018-01-01

The pulsed laser-generated plasma in vacuum and at low and high intensities can be characterized using different physical diagnostics. The charge particles emission can be characterized using magnetic, electric and magnet-electrical spectrometers. Such on-line techniques are often based on time-of-flight (TOF) measurements. A 90° electric deflection system is employed as ion energy analyzer (IEA) acting as a filter of the mass-to-charge ratio of emitted ions towards a secondary electron multiplier. It determines the ion energy and charge state distributions. The measure of the ion and electron currents as a function of the mass-to-charge ratio can be also determined by a magnetic deflector spectrometer, using a magnetic field of the order of 0.35 T, orthogonal to the ion incident direction, and an array of little ion collectors (IC) at different angles. A Thomson parabola spectrometer, employing gaf-chromix as detector, permits to be employed for ion mass, energy and charge state recognition. Mass quadrupole spectrometry, based on radiofrequency electric field oscillations, can be employed to characterize the plasma ion emission. Measurements performed on plasma produced by different lasers, irradiation conditions and targets are presented and discussed. Complementary measurements, based on mass and optical spectroscopy, semiconductor detectors, fast CCD camera and Langmuir probes are also employed for the full plasma characterization. Simulation programs, such as SRIM, SREM, and COMSOL are employed for the charge particle recognition.

Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

DEFF Research Database (Denmark)

Bogdanović Radović, Iva; Siketić, Zdravko; Jembrih-Simbürger, Dubravka

2017-01-01

Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identi......Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could...... be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for Me......V Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples...

Microscope mode secondary ion mass spectrometry imaging with a Timepix detector.

NARCIS (Netherlands)

Kiss, A.; Jungmann, JH; Smith, D.F.; Heeren, R.M.A.

2013-01-01

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a secondary ion mass spectrometer for microscope mode secondary ion mass spectrometry (SIMS)

Secondary electron emission from metals and semi-conductor compounds

International Nuclear Information System (INIS)

Ono, Susumu; Kanaya, Koichi

1979-01-01

Attempt was made to present the sufficient solution of the secondary electron yield of metals and semiconductor compounds except insulators, applying the free electron scattering theory to the absorption of secondary electrons generated within a solid target. The paper is divided into the sections describing absorption coefficient and escape depth, quantitative characteristics of secondary yield, angular distribution of secondary electron emission, effect of incident angle to secondary yield, secondary electron yield transmitted, and lateral distribution of secondary electron emission, besides introduction and conclusion. The conclusions are as follows. Based on the exponential power law for screened atomic potential, secondary electron emission due to both primary and backscattered electrons penetrating into metallic elements and semi-conductive compounds is expressed in terms of the ionization loss in the first collision for escaping secondary electrons. The maximum yield and the corresponding primary energy can both consistently be derived as the functions of three parameters: atomic number, first ionization energy and backscattering coefficient. The yield-energy curve as a function of the incident energy and the backscattering coefficient is in good agreement with the experimental results. The energy dependence of the yield in thin films and the lateral distribution of secondary yield are derived as the functions of the backscattering coefficient and the primary energy. (Wakatsuki, Y.)

Study of the secondary electron emission during bombardment of metal targets by positive D{sup +} and D{sub 2}{sup +} ions (1960); Etude de l'emission secondaire d'electrons au cours du bombardement de cibles metalliques par des ions positifs D{sup +} et D{sub 2}{sup +} (1960)

Energy Technology Data Exchange (ETDEWEB)

Leroy, J [Commissariat a l' Energie Atomique, Saclay (France).Centre d' Etudes Nucleaires; Prelec, K [Institut Rudjer Boskovic, Zagreb (Croatia)

1960-07-01

The secondary electron yield {gamma}-bar due to primary positive ions D{sup +} and D{sup +}{sub 2} has been measured in the 70 keV to 300 keV ion energy range. Several metallic targets have been used. The variation of this yield with the angle of incidence is proportional to sec {theta} where {theta} is the angle between the beam of primary ions and the normal to the target surface. The values {gamma}-bar decrease for increasing energy ions. At a given energy all the targets tried gave approximately the same electron yield. (author) [French] Le facteur d'emission secondaire a ete mesure pour des ions positifs D{sup +} et D{sup +}{sub 2} ayant une energie comprise entre 70 keV et 300 keV, sur differentes cibles metalliques. La variation de ce facteur avec l'angle d'incidence suit une loi de la forme {gamma}{sub 0} sec {theta}, {theta} etant l'angle entre le faisceau et la normale a la cible. Les valeurs de {gamma}-bar trouvees decroissent lorsque l'energie des ions incidents augmente, mais sont assez voisines les unes des autres, a une energie donnee, pour les differentes cibles essayees. (auteur)

Modeling of secondary emission processes in the negative ion based electrostatic accelerator of the International Thermonuclear Experimental Reactor

OpenAIRE

G. Fubiani; H. P. L. de Esch; A. Simonin; R. S. Hemsworth

2008-01-01

The negative ion electrostatic accelerator for the neutral beam injector of the International Thermonuclear Experimental Reactor (ITER) is designed to deliver a negative deuterium current of 40 A at 1 MeV. Inside the accelerator there are several types of interactions that may create secondary particles. The dominating process originates from the single and double stripping of the accelerated negative ion by collision with the residual molecular deuterium gas (≃29% losses). The resulting seco...

Secondary Emission Calorimeter Sensor Development

Science.gov (United States)

Winn, David R.; Onel, Yasar

2012-12-01

In a Secondary Emission electron(SEe) detector module, Secondary Emission electrons (SEe) are generated from an SE surface/cathode, when charged hadronic or electromagnetic particles, particularly shower particles, penetrate an SE sampling module placed between absorber materials (Fe, Cu, Pb, W etc) in calorimeters. The SE cathode is a thin (10-50 nm thick) film (simple metal-oxides, or other higher yield materials) on the surface of a metal plate, which serves as the entrance “window” to a compact vacuum vessel (metal or metal-ceramic); this SE film cathode is analogous to a photocathode, and the SEe are similar to p.e., which are then amplified by dynodes, also is in a PMT. SE sensor modules can make use of electrochemically etched/machined or laser-cut metal mesh dynode sheets, as large as ~30 cm square, to amplify the Secondary Emission Electrons (SEe), much like those that compact metal mesh or mesh dynode PMT's use to amplify p.e.'s. The construction requirements easier than a PMT, since the entire final assembly can be done in air; there are no critical controlled thin film depositions, cesiation or other oxygen-excluded processes or other required vacuum activation, and consequently bake-out can be a refractory temperatures; the module is sealed by normal vacuum techniques (welding or brazing or other high temperature joinings), with a simple final heated vacuum pump-out and tip-off. The modules envisioned are compact, high gain, high speed, exceptionally radiation damage resistant, rugged, and cost effective, and can be fabricated in arbitrary tileable shapes. The SE sensor module anodes can be segmented transversely to sizes appropriate to reconstruct electromagnetic cores with high precision. The GEANT4 and existing calorimeter data estimated calorimeter response performance is between 35-50 Secondary Emission electrons per GeV, in a 1 cm thick Cu absorber calorimeter, with a gain per SEe > 105 per SEe, and an e/pi<1.2. The calorimeter pulse width is

Incident ion charge state dependence of electron emission during slow multicharged ion-surface interactions

International Nuclear Information System (INIS)

Hughes, I.G.; Zeijlmans van Emmichoven, P.A.; Havener, C.C.; Overbury, S.H.; Robinson, M.T.; Zehner, D.M.; Meyer, F.W.

1992-01-01

Characteristic variations in the total electron yield γ as a function of crystal azimuthal orientation are reported for slow N 2+ , N 5+ and N 6+ ions incident on a Au(011) single crystal, together with measurements of γ as a function of incident ion velocity. Kinetic electron emission is shown to arise predominantly in close collisions between incident ions and target atoms, and potential electron emission is found to be essentially constant within our present velocity range. The incident ion charge state is shown to play no role in kinetic electron emission. Extremely fast neutralization times of the order of 10 - 15 secs are needed to explain the observations

Spin-dependent electron emission from metals in the neutralization of He+ ions

International Nuclear Information System (INIS)

Alducin, M.; Roesler, M.; Juaristi, J.I.; Muino, R. Diez; Echenique, P.M.

2005-01-01

We calculate the spin-polarization of electrons emitted in the neutralization of He + ions interacting with metals. All stages of the emission process are included: the spin-dependent perturbation induced by the projectile, the excitation of electrons in Auger neutralization processes, the creation of a cascade of secondaries, and the escape of the electrons through the surface potential barrier. The model allows us to explain in quantitative terms the measured spin-polarization of the yield in the interaction of spin-polarized He + ions with paramagnetic surfaces, and to disentangle the role played by each of the involved mechanisms. We show that electron-electron scattering processes at the surface determine the spin-polarization of the total yield. High energy emitted electrons are the ones providing direct information on the He + ion neutralization process and on the electronic properties of the surface

Electron emission during multicharged ion-metal surface interactions

International Nuclear Information System (INIS)

Zeijlmans van Emmichoven, P.A.; Havener, C.C.; Hughes, I.G.; Overbury, S.H.; Robinson, M.T.; Zehner, D.M.; Meyer, F.W.

1992-01-01

The electron emission during multicharged ion-metal surface interactions will be discussed. The interactions lead to the emission of a significant number of electrons. Most of these electrons have energies below 30 eV. For incident ions with innershell vacancies the emission of Auger electrons that fill these vacancies has been found to occur mainly below the surface. We will present recently measured electron energy distributions which will be used to discuss the mechanisms that lead to the emission of Auger and of low-energy electrons

Bistable intrinsic charge fluctuations of a dust grain subject to secondary electron emission in a plasma.

Science.gov (United States)

Shotorban, B

2015-10-01

A master equation was formulated to study intrinsic charge fluctuations of a grain in a plasma as ions and primary electrons are attached to the grain through collisional collection, and secondary electrons are emitted from the grain. Two different plasmas with Maxwellian and non-Maxwellian distributions were considered. The fluctuations could be bistable in either plasma when the secondary electron emission is present, as two stable macrostates, associated with two stable roots of the charge net current, may exist. Metastablity of fluctuations, manifested by the passage of the grain charge between two macrostates, was shown to be possible.

Secondary emission detectors for fixed target experiments at Fermilab

International Nuclear Information System (INIS)

Drucker, R.; Ford, R.; Tassotto, G.

1998-02-01

A description of a Secondary Emission Electron Detector (SEED) is given. The SEEDs provide accurate profiles and positions at small wire spacing (125-500 mm) in a high energy, high rate environment that exceeds the capabilities of traditional segmented wire ion chambers (SWICs). This device has been designed and constructed to monitor beam position and profile of two fixed target beamlines, namely, KTeV (FNAL E-799, E-832) with an average beam sigma at target of 0.22 mm and NuTeV (FNAL E-815) with a sigma = 0.6 mm. KTeV took beam at an intensity of up to 5E12 800 GeV protons over a 20 sec spill and NuTeV received 1E13 800 GeV protons in five pings/spill

The matrix effect in secondary ion mass spectrometry

Science.gov (United States)

Seah, M. P.; Shard, A. G.

2018-05-01

Matrix effects in the secondary ion mass spectrometry (SIMS) of selected elemental systems have been analyzed to investigate the applicability of a mathematical description of the matrix effect, called here the charge transfer (CT) model. This model was originally derived for proton exchange and organic positive secondary ions, to characterise the enhancement or suppression of intensities in organic binary systems. In the systems considered in this paper protons are specifically excluded, which enables an assessment of whether the model applies for electrons as well. The present importance is in organic systems but, here we analyse simpler inorganic systems. Matrix effects in elemental systems cannot involve proton transfer if there are no protons present but may be caused by electron transfer and so electron transfer may also be involved in the matrix effects for organic systems. There are general similarities in both the magnitudes of the ion intensities as well as the matrix effects for both positive and negative secondary ions in both systems and so the CT model may be more widely applicable. Published SIMS analyses of binary elemental mixtures are analyzed. The data of Kim et al., for the Pt/Co system, provide, with good precision, data for such a system. This gives evidence for the applicability of the CT model, where electron, rather than proton, transfer is the matrix enhancing and suppressing mechanism. The published data of Prudon et al., for the important Si/Ge system, provides further evidence for the effects for both positive and negative secondary ions and allows rudimentary rules to be developed for the enhancing and suppressing species.

Negative ion emission at field electron emission from amorphous (alpha-C:H) carbon

CERN Document Server

Bernatskij, D P; Ivanov-Omskij, V I; Pavlov, V G; Zvonareva, T K

2001-01-01

The study on the electrons field emission from the plane cathode surface on the basis of the amorphous carbon film (alpha-C:H) is carried out. The methodology, making it possible to accomplish simultaneously the registration of the emission currents and visually observe the distribution of the emission centers on the plane emitter surface is developed. The analysis of the oscillograms indicated that apart from the proper electron constituent the negative ions of hydrogen (H sup - and H sub 2 sup -), carbon (C sup -) and hydrocarbon (CH sub n sup -) are observed. The ions emission is connected with the processes of formation and degradation of the local emission centers

Axial ion-electron emission microscopy of IC radiation hardness

Science.gov (United States)

Doyle, B. L.; Vizkelethy, G.; Walsh, D. S.; Swenson, D.

2002-05-01

A new system for performing radiation effects microscopy (REM) has been developed at Sandia National Laboratory in Albuquerque. This system combines two entirely new concepts in accelerator physics and nuclear microscopy. A radio frequency quadrupole (RFQ) linac is used to boost the energy of ions accelerated by a conventional Tandem Van de Graaff-Pelletron to velocities of 1.9 MeV/amu. The electronic stopping power for heavy ions is near a maximum at this velocity, and their range is ˜20 μm in Si. These ions therefore represent the most ionizing form of radiation in nature, and are nearly ideal for performing single event effects testing of integrated circuits. Unfortunately, the energy definition of the RFQ-boosted ions is rather poor (˜ a few %), which makes problematic the focussing of such ions to the submicron spots required for REM. To circumvent this problem, we have invented ion electron emission microscopy (IEEM). One can perform REM with the IEEM system without focussing or scanning the ion beam. This is because the position on the sample where each ion strikes is determined by projecting ion-induced secondary electrons at high magnification onto a single electron position sensitive detector. This position signal is then correlated with each REM event. The IEEM system is now mounted along the beam line in an axial geometry so that the ions pass right through the electron detector (which is annular), and all of the electrostatic lenses used for projection. The beam then strikes the sample at normal incidence which results in maximum ion penetration and removes a parallax problem experienced in an earlier system. Details of both the RFQ-booster and the new axial IEEM system are given together with some of the initial results of performing REM on Sandia-manufactured radiation hardened integrated circuits.

Secondary electron emission studied by secondary electron energy loss coincidence spectroscopy (SE2ELCS)

International Nuclear Information System (INIS)

Khalid, R.

2013-01-01

Emission of secondary electrons is of importance in many branches of fundamental and applied science. It is widely applied in the electron microscope for the investigation of the structure and electronic state of solid surfaces and particle detection in electron multiplier devices, and generally it is related to the energy dissipation of energetic particles moving inside a solid. The process of secondary electron emission is a complex physical phenomenon, difficult to measure experimentally and treat theoretically with satisfactory accuracy. The secondary electron spectrum measured with single electron spectroscopy does not provide detailed information of the energy loss processes responsible for the emission of secondary electrons. This information can be accessed when two correlated electron pairs are measured in coincidence and the pair consists of a backscattered electron after a given energy loss and a resulting emitted secondary electron. To investigate the mechanisms responsible for the emission of secondary electrons, a reflection (e,2e) coincidence spectrometer named Secondary Electron Electron Energy Loss Coincidence Spectrometer (SE2ELCS) has been developed in the framework of this thesis which allows one to uncover the relation between the features in the spectra which are due to energy losses and true secondary electron emission structures. The correlated electron pairs are measured with a hemispherical mirror analyzer (HMA) and a time of flight analyzer (TOF) by employing a continuous electron beam. An effort has been made to increase the coincidence count rate by increasing the effective solid angle of the TOF analyzer and optimizing the experimental parameters to get optimum energy resolution. Double differential coincidence spectra for a number of materials namely, nearly free electron metals (Al, Si), noble metals (Ag, Au, Cu, W) and highly oriented pyrolytic graphite (HOPG) have been measured using this coincidence spectrometer. The

Self-sputtering runaway in high power impulse magnetron sputtering: The role of secondary electrons and multiply charged metal ions

International Nuclear Information System (INIS)

Anders, Andre

2008-01-01

Self-sputtering runaway in high power impulse magnetron sputtering is closely related to the appearance of multiply charged ions. This conclusion is based on the properties of potential emission of secondary electrons and energy balance considerations. The effect is especially strong for materials whose sputtering yield is marginally greater than unity. The absolute deposition rate increases ∼Q 1/2 , whereas the rate normalized to the average power decreases ∼Q -1/2 , with Q being the mean ion charge state number

Super TOF secondary ion mass spectroscopy using very highly charged primary ions up to Th70+

International Nuclear Information System (INIS)

Briere, M.A.; Schenkel, T.; Schneider, D.

1995-01-01

The LLNL Electron Beam Ion Trap (EBIT) has made low emittance beams of slow highly charged ions available for ion-solid interaction studies. Such interactions feature the dominance of electronic over collisional effects, and the shock waves generated by the ionized target atoms can desorb large numbers of large molecular species from the surface. This paper presents the first systematic study of the sputtering process due to the incidence of slow very highly charged ions; Th 70+ ions are extracted from EBIT at 7 keV * q and directed onto thin SiO 2 films on Si. Results suggest secondary ion yields of up to 25 per incident ion for Th 70+ (secondary ion yield is increased over that for singly or moderately charged ions). Correlations of the negative, positive, and negative cluster ion yields show promise for application of highly charged ion induced sputtering for enhanced sensitivity and quantitative (absolute) SIMS analysis of deep submicron scale surface layers and polymeric and biomolecular material analysis

Electron emission during multicharged ion-surface interactions

International Nuclear Information System (INIS)

Zeijlmans van Emmichoven, P.A.; Havener, C.C.; Meyer, F.W.; Zehner, D.M.

1990-01-01

Recent measurements of electron spectra for slow multicharged N ion-surface collisions are presented. The emphasis is on potential emission, i.e. the electron emission related to the neutralization of the ions. When using N ions that carry a K shell vacancy into the collision, characteristic K Auger electron emission from the projectiles is observed, as well as, for specific surfaces, target atom Auger transitions (resulting from vacancy transfer). Measurements of the intensity of these Auger transitions as a function of the time the ions spend above the surface can serve as a useful probe of the timescales characterizing the relevant neutralization processes. This technique is elucidated with the help of some computer simulations. It is shown that neutralization timescales required in the atomic ladder picture, in which neutralization takes place by resonant capture followed by purely intra-atomic Auger transitions, are too long to explain our experimental results. The introduction of additional neutralization/de-excitation mechanisms in the simulations leads to much better agreement with the experiments

Secondary electron emission with molecular projectiles

International Nuclear Information System (INIS)

Kroneberger, K.; Rothard, H.; Koschar, P.; Lorenzen, P.; Kemmler, J.; Keller, N.; Maier, R.; Groeneveld, K.O.; Clouvas, A.; Veje, E.

1990-01-01

The authors present results for the secondary electron emission (SEE) from thin foil targets, induced by both molecular ions and their atomic constituents as projectiles. The Sternglass theory for kinetic SEE states a proportionality between γ and the electronic stopping power, S e , which has been verified in various experiments. With comparing secondary electron (SE) yields induced by molecular projectiles to those induced by monoatomic projectiles, it is therefore possible to test models for the energy loss of molecular or cluster projectiles. Since the atomic constituents of the molecule are repelled from each other due to Coulomb explosion (superimposed by multiple scattering) while traversing the solid, it is interesting to measure the residual mutual influence on SEE and S e with increasing internuclear separation. This can only be achieved with thin foils, where (as in the present case) the SE-yields from the exit surface can be measured separately. The authors measured the SE-yields from the entrance (γ B ) and exit (γ F ) surfaces of thin C- and Al-foils (150 to 1,000 angstrom) with CO + , C + and O + (15 to 85 keV/u) and H 2 + and H + (0.3 to 1.2 MeV/u). The molecular effect defined as the ratio R(γ) between the yields induced by molecular projectiles and the sum of those induced by their atomic constituents was calculated. The energy dependence of R(γ) can be well represented by the calculated energy loss ratio of di-proton-clusters by Brandt. This supports Brandt's model for the energy loss of clusters

Bi-Directional Ion Emission from Massive Gold Cluster Impacts on Nanometric Carbon Foils.

Science.gov (United States)

Debord, J Daniel; Della-Negra, Serge; Fernandez-Lima, Francisco A; Verkhoturov, Stanislav V; Schweikert, Emile A

2012-04-12

Carbon cluster emission from thin carbon foils (5-40 nm) impacted by individual Au(n) (+q) cluster projectiles (95-125 qkeV, n/q = 3-200) reveals features regarding the energy deposition, projectile range, and projectile fate in matter as a function of the projectile characteristics. For the first time, the secondary ion emission from thin foils has been monitored simultaneously in both forward and backward emission directions. The projectile range and depth of emission were examined as a function of projectile size, energy, and target thickness. A key finding is that the massive cluster impact develops very differently from that of a small polyatomic projectile. The range of the 125 qkeV Au(100q) (+q) (q ≈ 4) projectile is estimated to be 20 nm (well beyond the range of an equal velocity Au(+)) and projectile disintegration occurs at the exit of even a 5 nm thick foil.

Subnanosecond breakdown development in high-voltage pulse discharge: Effect of secondary electron emission

Science.gov (United States)

Alexandrov, A. L.; Schweigert, I. V.; Zakrevskiy, Dm. E.; Bokhan, P. A.; Gugin, P.; Lavrukhin, M.

2017-10-01

A subnanosecond breakdown in high-voltage pulse discharge may be a key tool for superfast commutation of high power devices. The breakdown in high-voltage open discharge at mid-high pressure in helium was studied in experiment and in kinetic simulations. The kinetic model of electron avalanche development was constructed, based on PIC-MCC simulations, including dynamics of electrons, ions and fast helium atoms, produced by ions scattering. Special attention was paid to electron emission processes from cathode, such as: photoemission by Doppler-shifted resonant photons, produced in excitation processes involving fast atoms; electron emission by ions and fast atoms bombardment of cathode; the secondary electron emission (SEE) by hot electrons from bulk plasma. The simulations show that the fast atoms accumulation is the main reason of emission growth at the early stage of breakdown, but at the final stage, when the voltage on plasma gap diminishes, namely the SEE is responsible for subnanosecond rate of current growth. It was shown that the characteristic time of the current growth can be controlled by the SEE yield. The influence of SEE yield for three types of cathode material (titanium, SiC, and CuAlMg-alloy) was tested. By changing the pulse voltage amplitude and gas pressure, the area of existence of subnanosecond breakdown is identified. It is shown that in discharge with SiC and CuAlMg-alloy cathodes (which have enhanced SEE) the current can increase with a subnanosecond characteristic time value as small as τs = 0.4 ns, for the pulse voltage amplitude of 5÷12 kV. An increase of gas pressure from 15 Torr to 30 Torr essentially decreases the time of of current front growth, whereas the pulse voltage variation weakly affects the results.

L X-ray emission induced by heavy ions

Energy Technology Data Exchange (ETDEWEB)

Pajek, M. [Institute of Physics, Jan Kochanowski University, 25-406 Kielce (Poland); Banaś, D., E-mail: d.banas@ujk.edu.pl [Institute of Physics, Jan Kochanowski University, 25-406 Kielce (Poland); Braziewicz, J.; Majewska, U.; Semaniak, J. [Institute of Physics, Jan Kochanowski University, 25-406 Kielce (Poland); Fijał-Kirejczyk, I. [The Institute of Atomic Energy, 05-400 Otwock-Świerk (Poland); Jaskóła, M.; Czarnacki, W.; Korman, A. [The National Centre for Nuclear Research, 05-400 Otwock-Świerk (Poland); Kretschmer, W. [Physikalisches Institut, Universität Erlangen-Nürnberg, D-91058 Erlangen (Germany); Mukoyama, T. [Institute for Nuclear Research, Hungarian Academy of Sciences (ATOMKI), H-4026 Debrecen (Hungary); Trautmann, D. [Institut für Physik, Universität Basel, Basel (Switzerland)

2015-11-15

Particle-induced X-ray emission (PIXE) technique is usually applied using typically 1 MeV to 3 MeV protons or helium ions, for which the ion-atom interaction is dominated by the single ionization process. For heavier ions the multiple ionization plays an increasingly important role and this process can influence substantially both the X-ray spectra and atomic decay rates. Additionally, the subshell coupling effects are important for the L- and M-shells ionized by heavy ions. Here we discuss the main features of the X-ray emission induced by heavy ions which are important for PIXE applications, namely, the effects of X-ray line shifts and broadening, vacancy rearrangement and change of the fluorescence and Coster–Kronig yields in multiple ionized atoms. These effects are illustrated here by the results of the measurements of L X-ray emission from heavy atoms bombarded by 6 MeV to 36 MeV Si ions, which were reported earlier. The strong L-subshell coupling effects are observed, in particular L{sub 2}-subshell, which can be accounted for within the coupling subshell model (CSM) developed within the semiclassical approximation. Finally, the prospects to use heavy ions in PIXE analysis are discussed.

Ion detection in mass spectrometry

International Nuclear Information System (INIS)

Bolbach, Gerard

2016-03-01

This course aims at providing some elements for a better understanding of ion detectors used in mass spectrometers, of their operations, and of their limitations. A first part addresses the functions and properties of an ideal detector, how to detect ions in gas phase, and particle detectors and ion detectors used in mass spectrometry. The second part proposes an overview of currently used detectors with respect to their operation principle: detection from the ion charge (Faraday cylinder), detection by inductive effects (FTICR, Fourier Transform Ion Cyclotron Resonance), and detection by secondary electron emission. The third part discusses the specificities of secondary electron emission. The fourth one addresses operating modes and parameters related to detectors. The sixth part proposes a prospective view on future detectors by addressing the following issues: cryo-detector, inductive effect and charge detectors, ion detection and nano materials

Irradiation effects on secondary structure of protein induced by keV ions

International Nuclear Information System (INIS)

Cui, F.Z.; Lin, Y.B.; Zhang, D.M.; Tian, M.B.

2001-01-01

Protein secondary structure changes by low-energy ion irradiation are reported for the first time. The selected system is 30 keV N + irradiation on bovine serum albumin (BSA). After irradiation at increasing fluences from 1.0x10 15 to 2.5x10 16 ion/cm 2 , Fourier transform infrared spectra analysis was conducted. It was found that the secondary structures of BSA molecules were very sensitive to ion irradiation. Secondary conformations showed different trends of change during irradiation. With the increase of ion fluence from 0 to 2.5x10 16 ion/cm 2 , the fraction of α-helix and β-turns decreased from 17 to 12%, and from 40 to 31%, respectively, while that of random coil and β-sheet structure increased from 18 to 27%, and from 25 to 30%, respectively. Possible explanations for the secondary conformational changes of protein are proposed. (author)

Formation of secondary inorganic aerosols by power plant emissions exhausted through cooling towers in Saxony.

Science.gov (United States)

Hinneburg, Detlef; Renner, Eberhard; Wolke, Ralf

2009-01-01

The fraction of ambient PM10 that is due to the formation of secondary inorganic particulate sulfate and nitrate from the emissions of two large, brown-coal-fired power stations in Saxony (East Germany) is examined. The power stations are equipped with natural-draft cooling towers. The flue gases are directly piped into the cooling towers, thereby receiving an additionally intensified uplift. The exhausted gas-steam mixture contains the gases CO, CO2, NO, NO2, and SO2, the directly emitted primary particles, and additionally, an excess of 'free' sulfate ions in water solution, which, after the desulfurization steps, remain non-neutralized by cations. The precursor gases NO2 and SO2 are capable of forming nitric and sulfuric acid by several pathways. The acids can be neutralized by ammonia and generate secondary particulate matter by heterogeneous condensation on preexisting particles. The simulations are performed by a nested and multi-scale application of the online-coupled model system LM-MUSCAT. The Local Model (LM; recently renamed as COSMO) of the German Weather Service performs the meteorological processes, while the Multi-scale Atmospheric Transport Model (MUSCAT) includes the transport, the gas phase chemistry, as well as the aerosol chemistry (thermodynamic ammonium-sulfate-nitrate-water system). The highest horizontal resolution in the inner region of Saxony is 0.7 km. One summer and one winter episode, each realizing 5 weeks of the year 2002, are simulated twice, with the cooling tower emissions switched on and off, respectively. This procedure serves to identify the direct and indirect influences of the single plumes on the formation and distribution of the secondary inorganic aerosols. Surface traces of the individual tower plumes can be located and distinguished, especially in the well-mixed boundary layer in daytime. At night, the plumes are decoupled from the surface. In no case does the resulting contribution of the cooling tower emissions to PM10

Probabilistic model for the simulation of secondary electron emission

Directory of Open Access Journals (Sweden)

M. A. Furman

2002-12-01

Full Text Available We provide a detailed description of a model and its computational algorithm for the secondary electron emission process. The model is based on a broad phenomenological fit to data for the secondary-emission yield and the emitted-energy spectrum. We provide two sets of values for the parameters by fitting our model to two particular data sets, one for copper and the other one for stainless steel.

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Energy Technology Data Exchange (ETDEWEB)

Mahoney, Christine M. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)]. E-mail: christine.mahoney@nist.gov; Fahey, Albert J. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Gillen, Greg [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Xu Chang [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Batteas, James D. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)

2006-07-30

Secondary ion mass spectrometry (SIMS) employing an SF{sub 5} {sup +} polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from -125 deg. C to 150 deg. C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced interfacial widths as compared to analysis at ambient temperature. Atomic force microscopy (AFM) images indicated that this improvement in interfacial width may be related to a decrease in sputter-induced topography. Depth profiling at higher temperatures was typically correlated with increased sputter rates. However, the improvements in interfacial widths and overall secondary ion stability were not as prevalent as was observed at low temperature. For PLA, improvements in signal intensities were observed at low temperatures, yet there was no significant change in secondary ion stability, interface widths or sputter rates. High temperatures yielded a significant decrease in secondary ion stability of the resulting profiles. PS films showed rapid degradation of characteristic secondary ion signals under all temperatures examined.

Secondary ion formation during electronic and nuclear sputtering of germanium

Science.gov (United States)

Breuer, L.; Ernst, P.; Herder, M.; Meinerzhagen, F.; Bender, M.; Severin, D.; Wucher, A.

2018-06-01

Using a time-of-flight mass spectrometer attached to the UNILAC beamline located at the GSI Helmholtz Centre for Heavy Ion Research, we investigate the formation of secondary ions sputtered from a germanium surface under irradiation by swift heavy ions (SHI) such as 5 MeV/u Au by simultaneously recording the mass spectra of the ejected secondary ions and their neutral counterparts. In these experiments, the sputtered neutral material is post-ionized via single photon absorption from a pulsed, intensive VUV laser. After post-ionization, the instrument cannot distinguish between secondary ions and post-ionized neutrals, so that both signals can be directly compared in order to investigate the ionization probability of different sputtered species. In order to facilitate an in-situ comparison with typical nuclear sputtering conditions, the system is also equipped with a conventional rare gas ion source delivering a 5 keV argon ion beam. For a dynamically sputter cleaned surface, it is found that the ionization probability of Ge atoms and Gen clusters ejected under electronic sputtering conditions is by more than an order of magnitude higher than that measured for keV sputtered particles. In addition, the mass spectra obtained under SHI irradiation show prominent signals of GenOm clusters, which are predominantly detected as positive or negative secondary ions. From the m-distribution for a given Ge nuclearity n, one can deduce that the sputtered material must originate from a germanium oxide matrix with approximate GeO stoichiometry, probably due to residual native oxide patches even at the dynamically cleaned surface. The results clearly demonstrate a fundamental difference between the ejection and ionization mechanisms in both cases, which is interpreted in terms of corresponding model calculations.

Effect of secondary electron emission on the Jeans instability in a dusty plasma

International Nuclear Information System (INIS)

Sarkar, Susmita; Roy, Banamali; Maity, Saumyen; Khan, Manoranjan; Gupta, M. R.

2007-01-01

In this paper the effect of secondary electron emission on Jeans instability in a dusty plasma has been investigated. Due to secondary electron emission, dust grains may have two stable equilibrium states out of which one is negative and the other is positive. Here both cases have been considered separately. It has been shown that secondary electron emission enhances Jeans instability when equilibrium dust charge is negative. It has also been shown that growth rate of Jeans instability reduces with increasing secondary electron emission when equilibrium dust charge is positive

Emission characteristics of negative oxygen ions into vacuum from cerium oxide

International Nuclear Information System (INIS)

Sakai, Takaaki; Fujiwara, Yukio; Kaimai, Atsushi; Yashiro, Keiji; Matsumoto, Hiroshige; Nigara, Yutaka; Kawada, Tatsuya; Mizusaki, Junichiro

2006-01-01

The oxygen ion emission characteristics of CeO 2 were studied under electric field in a vacuum chamber to find a candidate material for a novel ion source, 'solid oxide ion source (SOIS)'. The emission current was observed from CeO 2 under a pressure of around 10 -3 Pa, at the temperature ranging from 973 K to 1173 K. It was found that the emission current increased with temperature and applied voltage. The ions emitted from CeO 2 were confirmed to be oxygen negative ions (O - ) by the use of quadrupole mass spectrometer. The emission current decreased with time as was observed in the earlier works with other oxide ion conductors such as stabilized zirconia or other materials . To enhance the emission current from CeO 2 , an introduction of donor into CeO 2 was tested using Ce 0.992 Nb 0.008 O 2 . For comparison, effect of acceptor doping was also tested using Ce 0.9 Gd 0.1 O 1.95 . The emission current from Ce 0.9 Gd 0.1 O 1.95 was smaller than that from donor-doped and pure CeO 2. Clear enhancement of the emission current was not observed with Ce 0.992 Nb 0.008 O 2

Suppression secondary electrons from target surface under pulsed ion beams bombardment

International Nuclear Information System (INIS)

Yang Zhen; Peng Yufei; Long Jidong; Lan Chaohui; Dong Pan; Shi Jinshui

2012-01-01

The producing mechanism of secondary electrons from target surface under ion beams bombardment is discussed. Several methods to suppress the secondary electrons in special vacuum devices and their advantages and disadvantages are introduced. The ways of using self-bias and curved surface target are proposed and verified in the experiment. The results show that the secondary electrons can be effectively suppressed when the self-bias is larger than 80 V. The secondary electron yield decreases by using curved surface target instead of flat target. The secondary electron yield calculated from the experimental data is about 0.67, which is slightly larger than the value (0.58) from the literature due to the impurities of the ion beam and target surface. The effect of suppressing the electron countercurrent by the self-bias method is analyzed. The result shows that the self-bias method can not only suppress the secondary electrons from target surface under ion beams bombardment, but also suppress the electron countercurrent resulting from the instability of the pulsed power source. (authors)

An experimental study of electron transfer and emission during particle-surface interactions

International Nuclear Information System (INIS)

McGrath, C.T.

2000-09-01

A new coincidence technique has been developed and used to study the secondary electron emission that arises during the interaction of ions with surfaces. This coincidence technique allows the secondary electron emission statistics due to the impact of singly, doubly and multiply charged ions on surfaces to be measured in coincidence with reflected particles, in specific charge states and with specific post-collision trajectories. This system has been used to study the impact of 8 keV H + ions on polycrystalline copper and aluminium targets. Under these conditions the potential emission contribution is negligible and the electron emission is almost entirely due to kinetic emission processes. The sub-surface contribution to the observed electron emission has been isolated using two newly developed models. These models provide valuable information about the depth and amount of surface penetration and on the probability for subsequent electron transport to the surface. The impact of 2 - 100 keV Xe q+ (q = 1 - 10) ions on polycrystalline copper has also been studied using this system. From the subsequent data the potential and kinetic contributions to secondary electron emission have been separated using a previously established model for potential emission. The resulting kinetic emission yield increases with increasing ion impact energy, consistent with current concepts on quasimolecular ionisation. For ions impacting at large incident angles evidence for sub-surface emission has also been observed. The degree of penetration increases with ion impact energy, consistent with current concepts on this effect. The formation of H - ions from incident H + ions has also been studied by measuring the secondary electron emission statistics in coincidence with reflected particles in specific final charge states. This preliminary data is consistent with a two-step process of Auger neutralisation followed by resonant electron capture to the affinity level. However this mechanism

High-energy particle emission from galena and pyrite bombarded with Cs and O ions

International Nuclear Information System (INIS)

Karpuzov, D.S.; McIntyre, N.S.

2002-01-01

The ejection of energetic particles during steady-state ion surface bombardment has been investigated by means of a dynamic computer simulation as well as in a secondary ion mass spectrometry (SIMS)/low-energy ion scattering from surfaces (LEIS) experiment. The emphasis of this comparative study is on the mass dependence of high-energy tails in sputtering and backscattering for the bombardment of galena (PbS) and pyrite (FeS 2 ) with keV energy ion beam of cesium and oxygen. In the experiment, kinetic energy distributions of sputtered secondary ions (S + , Fe + , Pb + , S - ), as well as backscattered or re-sputtered primary ions (Cs + , O + , O - ), have been measured on a modified Cameca IMS-3f magnetic sector mass spectrometer for keV cesium (Cs + ) and oxygen (O 2 + , O - ) bombardment of galena and pyrite. Ejection of high-energy particles, with emission energies of up to ∼40% or up to ∼60% of the bombarding energy for sputtering of the lighter component (S ± ) with cesium or oxygen, respectively, and of up to ∼40% (Cs + ) and ∼80% (O ± ) for backscattering, has been observed for PbS. The computer simulations were based on the well-known MARLOWE code. In order to model the change of the stoichiometry of the binary compounds, dynamic modification of the target composition in the near-surface region was introduced. Cs incorporation was included, and a relative enrichment of the metallic component (Pb, Fe) in the top few layers due to preferential sputtering of sulfur was allowed. The computer simulations provide information on the formation of altered layer under sputter equilibrium as well as on the energy and angular emission distributions of sputtered and backscattered particles in steady-state conditions. Multiple scattering of Cs projectiles and dynamic re-sputtering of cesium that was previously incorporated in the altered near-surface region can be distinguished in the simulation, and matched with the experimental observations. In addition

Toxic fluoride gas emissions from lithium-ion battery fires.

Science.gov (United States)

Larsson, Fredrik; Andersson, Petra; Blomqvist, Per; Mellander, Bengt-Erik

2017-08-30

Lithium-ion battery fires generate intense heat and considerable amounts of gas and smoke. Although the emission of toxic gases can be a larger threat than the heat, the knowledge of such emissions is limited. This paper presents quantitative measurements of heat release and fluoride gas emissions during battery fires for seven different types of commercial lithium-ion batteries. The results have been validated using two independent measurement techniques and show that large amounts of hydrogen fluoride (HF) may be generated, ranging between 20 and 200 mg/Wh of nominal battery energy capacity. In addition, 15-22 mg/Wh of another potentially toxic gas, phosphoryl fluoride (POF 3 ), was measured in some of the fire tests. Gas emissions when using water mist as extinguishing agent were also investigated. Fluoride gas emission can pose a serious toxic threat and the results are crucial findings for risk assessment and management, especially for large Li-ion battery packs.

Transport of secondary electrons and reactive species in ion tracks

Science.gov (United States)

Surdutovich, Eugene; Solov'yov, Andrey V.

2015-08-01

The transport of reactive species brought about by ions traversing tissue-like medium is analysed analytically. Secondary electrons ejected by ions are capable of ionizing other molecules; the transport of these generations of electrons is studied using the random walk approximation until these electrons remain ballistic. Then, the distribution of solvated electrons produced as a result of interaction of low-energy electrons with water molecules is obtained. The radial distribution of energy loss by ions and secondary electrons to the medium yields the initial radial dose distribution, which can be used as initial conditions for the predicted shock waves. The formation, diffusion, and chemical evolution of hydroxyl radicals in liquid water are studied as well. COST Action Nano-IBCT: Nano-scale Processes Behind Ion-Beam Cancer Therapy.

Sheath structure transition controlled by secondary electron emission

Science.gov (United States)

Schweigert, I. V.; Langendorf, S. J.; Walker, M. L. R.; Keidar, M.

2015-04-01

In particle-in-cell Monte Carlo collision (PIC MCC) simulations and in an experiment we study sheath formation over an emissive floating Al2O3 plate in a direct current discharge plasma at argon gas pressure 10-4 Torr. The discharge glow is maintained by the beam electrons emitted from a negatively biased hot cathode. We observe three types of sheaths near the floating emissive plate and the transition between them is driven by changing the negative bias. The Debye sheath appears at lower voltages, when secondary electron emission is negligible. With increasing applied voltage, secondary electron emission switches on and a first transition to a new sheath type, beam electron emission (BEE), takes place. For the first time we find this specific regime of sheath operation near the floating emissive surface. In this regime, the potential drop over the plate sheath is about four times larger than the temperature of plasma electrons. The virtual cathode appears near the emissive plate and its modification helps to maintain the BEE regime within some voltage range. Further increase of the applied voltage U initiates the second smooth transition to the plasma electron emission sheath regime and the ratio Δφs/Te tends to unity with increasing U. The oscillatory behavior of the emissive sheath is analyzed in PIC MCC simulations. A plasmoid of slow electrons is formed near the plate and transported to the bulk plasma periodically with a frequency of about 25 kHz.

Noise in secondary electron emission: the low yield case

Czech Academy of Sciences Publication Activity Database

Frank, Luděk

2005-01-01

Roč. 54, č. 4 (2005), s. 361-365 ISSN 0022-0744 R&D Projects: GA AV ČR(CZ) IAA1065304 Keywords : secondary electrons * noise * SEM image noise * secondary emission noise * statistics of secondary electrons * non-Poisson factor Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 0.720, year: 2005

Secondary emission electron gun using external primaries

Science.gov (United States)

Srinivasan-Rao, Triveni [Shoreham, NY; Ben-Zvi, Ilan [Setauket, NY

2009-10-13

An electron gun for generating an electron beam is provided, which includes a secondary emitter. The secondary emitter includes a non-contaminating negative-electron-affinity (NEA) material and emitting surface. The gun includes an accelerating region which accelerates the secondaries from the emitting surface. The secondaries are emitted in response to a primary beam generated external to the accelerating region. The accelerating region may include a superconducting radio frequency (RF) cavity, and the gun may be operated in a continuous wave (CW) mode. The secondary emitter includes hydrogenated diamond. A uniform electrically conductive layer is superposed on the emitter to replenish the extracted current, preventing charging of the emitter. An encapsulated secondary emission enhanced cathode device, useful in a superconducting RF cavity, includes a housing for maintaining vacuum, a cathode, e.g., a photocathode, and the non-contaminating NEA secondary emitter with the uniform electrically conductive layer superposed thereon.

Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions

Science.gov (United States)

Bogdanović Radović, Iva; Siketić, Zdravko; Jembrih-Simbürger, Dubravka; Marković, Nikola; Anghelone, Marta; Stoytschew, Valentin; Jakšić, Milko

2017-09-01

Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses in the m/z range from 1 to 1200 could be identified in different paint samples with a high efficiency and in a single measurement. Different ways of mounting of mostly insulating paint samples were tested prior to the analysis in order to achieve the highest possible yield of pigment main molecular ions. As Time-of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry is attached to the heavy ion microprobe, molecular imaging on cross-sections of small paint fragments was performed using focused ions. Due to the fact that molecules are extracted from the uppermost layer of the sample and to avoid surface contamination, the paint samples were not embedded in the resin as is usually done when imaging of paint samples using different techniques in the field of cultural heritage.

Experimental study on secondary electron emission characteristics of Cu

Science.gov (United States)

Liu, Shenghua; Liu, Yudong; Wang, Pengcheng; Liu, Weibin; Pei, Guoxi; Zeng, Lei; Sun, Xiaoyang

2018-02-01

Secondary electron emission (SEE) of a surface is the origin of the multipacting effect which could seriously deteriorate beam quality and even perturb the normal operation of particle accelerators. Experimental measurements on secondary electron yield (SEY) for different materials and coatings have been developed in many accelerator laboratories. In fact, the SEY is just one parameter of secondary electron emission characteristics which include spatial and energy distribution of emitted electrons. A novel experimental apparatus was set up in China Spallation Neutron Source, and an innovative method was applied to obtain the whole characteristics of SEE. Taking Cu as the sample, secondary electron yield, its dependence on beam injection angle, and the spatial and energy distribution of secondary electrons were achieved with this measurement device. The method for spatial distribution measurement was first proposed and verified experimentally. This contribution also tries to give all the experimental results a reasonable theoretical analysis and explanation.

Secondary electron emission characteristics of oxide electrodes in flat electron emission lamp

Directory of Open Access Journals (Sweden)

Chang-Lin Chiang

2016-01-01

Full Text Available The present study concerns with the secondary electron emission coefficient, γ, of the cathode materials used in the newly developed flat electron emission lamp (FEEL devices, which essentially integrates the concept of using cathode for fluorescent lamp and anode for cathode ray tube (CRT to obtain uniform planar lighting. Three different cathode materials, namely fluorine-doped tin oxide (FTO, aluminum oxide coated FTO (Al2O3/FTO and magnesium oxide coated FTO (MgO/FTO were prepared to investigate how the variations of γ and working gases influence the performance of FEEL devices, especially in lowering the breakdown voltage and pressure of the working gases. The results indicate that the MgO/FTO bilayer cathode exhibited a relatively larger effective secondary electron emission coefficient, resulting in significant reduction of breakdown voltage to about 3kV and allowing the device to be operated at the lower pressure to generate the higher lighting efficiency.

Secondary electron emission characteristics of oxide electrodes in flat electron emission lamp

Energy Technology Data Exchange (ETDEWEB)

Chiang, Chang-Lin, E-mail: CLChiang@itri.org.tw; Li, Chia-Hung [Green Energy and Environment Research Laboratories, Industrial Technology Research Institute, 195, Sec. 4, Chung Hsing Road, Chutung 310, Taiwan (China); Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan (China); Zeng, Hui-Kai [Department of Electronic Engineering, Chung Yuan Christian University, 200 Chung Pei Road, Chung Li 320, Taiwan (China); Li, Jung-Yu, E-mail: JY-Lee@itri.org.tw; Chen, Shih-Pu; Lin, Yi-Ping [Green Energy and Environment Research Laboratories, Industrial Technology Research Institute, 195, Sec. 4, Chung Hsing Road, Chutung 310, Taiwan (China); Hsieh, Tai-Chiung; Juang, Jenh-Yih, E-mail: jyjuang@cc.nctu.edu.tw [Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu 300, Taiwan (China)

2016-01-15

The present study concerns with the secondary electron emission coefficient, γ, of the cathode materials used in the newly developed flat electron emission lamp (FEEL) devices, which essentially integrates the concept of using cathode for fluorescent lamp and anode for cathode ray tube (CRT) to obtain uniform planar lighting. Three different cathode materials, namely fluorine-doped tin oxide (FTO), aluminum oxide coated FTO (Al{sub 2}O{sub 3}/FTO) and magnesium oxide coated FTO (MgO/FTO) were prepared to investigate how the variations of γ and working gases influence the performance of FEEL devices, especially in lowering the breakdown voltage and pressure of the working gases. The results indicate that the MgO/FTO bilayer cathode exhibited a relatively larger effective secondary electron emission coefficient, resulting in significant reduction of breakdown voltage to about 3kV and allowing the device to be operated at the lower pressure to generate the higher lighting efficiency.

A new setup for the investigation of swift heavy ion induced particle emission and surface modifications

Energy Technology Data Exchange (ETDEWEB)

Meinerzhagen, F.; Breuer, L.; Bukowska, H.; Herder, M.; Schleberger, M.; Wucher, A. [Fakultät für Physik, Universität Duisburg-Essen and Cenide, 47057 Duisburg (Germany); Bender, M.; Severin, D. [GSI Helmholtzzentrum für Schwerionenforschung GmbH, 64291 Darmstadt (Germany); Lebius, H. [CIMAP (CEA-CNRS-ENSICAEN-UCN), 14070 Caen Cedex 5 (France)

2016-01-15

The irradiation with fast ions with kinetic energies of >10 MeV leads to the deposition of a high amount of energy along their trajectory (up to several ten keV/nm). The energy is mainly transferred to the electronic subsystem and induces different secondary processes of excitations, which result in significant material modifications. A new setup to study these ion induced effects on surfaces will be described in this paper. The setup combines a variable irradiation chamber with different techniques of surface characterizations like scanning probe microscopy, time-of-flight secondary ion, and neutral mass spectrometry, as well as low energy electron diffraction under ultra high vacuum conditions, and is mounted at a beamline of the universal linear accelerator (UNILAC) of the GSI facility in Darmstadt, Germany. Here, samples can be irradiated with high-energy ions with a total kinetic energy up to several GeVs under different angles of incidence. Our setup enables the preparation and in situ analysis of different types of sample systems ranging from metals to insulators. Time-of-flight secondary ion mass spectrometry enables us to study the chemical composition of the surface, while scanning probe microscopy allows a detailed view into the local electrical and morphological conditions of the sample surface down to atomic scales. With the new setup, particle emission during irradiation as well as persistent modifications of the surface after irradiation can thus be studied. We present first data obtained with the new setup, including a novel measuring protocol for time-of-flight mass spectrometry with the GSI UNILAC accelerator.

Z1 dependence of ion-induced electron emission from aluminum

International Nuclear Information System (INIS)

Alonso, E.V.; Baragiola, R.A.; Ferron, J.; Jakas, M.M.; Oliva-Florio, A.

1980-01-01

We have measured the electron emission yields γ of clean aluminum under bombardment with H + , H 2 + , D + , D 2 + , He + , B + , C + , N + , N 2 + , O + , O 2 + , F + , Ne + , S + , Cl + , Ar + , Kr + , and Xe + in the energy range 1.2--50 keV. The clean surfaces were prepared by in situ evaporation of high-purity Al under ultra-high-vacuum conditions. It is found that kinetic electron emission yields γ/sub k/, obtained after subtracting from the measured γ a contribution due to potential emission, are roughly proportional to the electronic stopping powers, for projectiles lighter than Al. For heavier projectiles there is a sizable contribution to electron emission from collisions involving rapidly recoiling target atoms, which increases with the mass of the projectile, and which dominates the threshold and near-threshold behavior of kinetic emission. The results, together with recently reported data on Auger electron emission from ion-bombarded Al show that the mechanism proposed by Parilis and Kishinevskii of inner-shell excitation and subsequent Auger decay is negligible for light ions and probably small for heavy ions on Al and in our energy range. We thus conclude that kinetic electron emission under bombardment by low-energy ions results mainly from the escape of excited valence electrons

Visualization of hydrogen in steels by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Takai, Kenichi

2000-01-01

Secondary ion mass spectrometry (SIMS) enables us to visualize hydrogen trapping sites in steels. Information about the hydrogen trapping sites in high-strength steels by SIMS is very important to discuss environmental embrittlement mechanism for developing steels with a high resistance to the environmental embrittlement. Secondary ion image analysis by SIMS has made possible to visualize the hydrogen and deuterium trapping sites in the steels. Hydrogen in tempered martensite steels containing Ca tends to accumulate on inclusions, at grain boundaries, and in segregation bands. Visualization of hydrogen desorption process by secondary ion image analysis confirms that the bonding between the inclusions and the hydrogen is strong. Cold-drawn pearlite steels trap hydrogen along cold-drawing direction. Pearlite phase absorbs the hydrogen more than ferrite phase does. This article introduces the principle of SIMS, its feature, analysis method, and results of hydrogen visualization in steels. (author)

Deviation from an inverse cosine dependence of kinetic secondary electron emission for angle of incidence at keV energy

International Nuclear Information System (INIS)

Ohya, Kaoru; Kawata, Jun; Mori, Ichiro

1989-01-01

Incident angle dependence of kinetic secondary electron emission from metals resulting from incidence of keV ions is investigated by computer simulation with the TRIM Monte Carlo program of ion scattering in matter. The results show large deviations from the inverse cosine dependence, which derives from high-energy approximation, because of a series of elastic collisions of incident ions with metal atoms. In the keV energy region, the elastic collisions have two different effects on the angular dependence for relatively high-energy light ions and for low-energy heavy ions: they result in over- and under-inverse-cosine dependences, respectively. The properties are observed even with an experiment of the keV-neutral incidence on a contaminated surface. In addition, the effects of the thin oxide layer and roughness on the surface are examined with simplified models. (author)

Innovation and its Management as Observed in the Lithium Ion Secondary Battery Business

OpenAIRE

正本, 順三

2008-01-01

At present, mobile phones and laptop computers are essential items in our daily life. As a battery for such portable devices, the lithium ion secondary battery is used. The lithium ion secondary battery, which is used as a battery for such portable devices, was first invented by Dr. Yoshino at Asahi Kasei, where the present author formerly worked. In this paper, the author describes how the lithium ion secondary battery was developed by the inventor, how the technology originated in Japan and...

Emission characteristics and stability of laser ion sources

Czech Academy of Sciences Publication Activity Database

Krása, Josef; Velyhan, Andriy; Krouský, Eduard; Láska, Leoš; Rohlena, Karel; Jungwirth, Karel; Ullschmied, Jiří; Lorusso, A.; Velardi, L.; Nassisi, V.; Czarnecka, A.; Ryc, L.; Parys, P.; Wolowski, J.

2010-01-01

Roč. 85, č. 5 (2010), s. 617-621 ISSN 0042-207X R&D Projects: GA AV ČR IAA100100715 Institutional research plan: CEZ:AV0Z10100523; CEZ:AV0Z20430508 Keywords : laser ion sources * ion emission reproducibility * thermal and fast ions * ion temperature * centre-of-mass velocity Subject RIV: BH - Optics, Masers, Lasers Impact factor: 1.048, year: 2010

Applications of simultaneous ion backscattering and ion-induced x-ray emission

International Nuclear Information System (INIS)

Musket, R.G.

1983-05-01

Simultaneous ion backscattering and ion-induced x-ray emission (E/sub x/greater than or equal to 300 eV) analyses have been performed using helium ions as probes of the first few hundred nanometers of various materials. These studies serve as a demonstration of the complementary nature of the two types of information obtained. Uncertainties associated with each of the individual techniques were reduced by performing both analyses. The principal advantages of simultaneous analyses over sequential analyses have been delineated

Ion induced electron emission statistics under Agm- cluster bombardment of Ag

Science.gov (United States)

Breuers, A.; Penning, R.; Wucher, A.

2018-05-01

The electron emission from a polycrystalline silver surface under bombardment with Agm- cluster ions (m = 1, 2, 3) is investigated in terms of ion induced kinetic excitation. The electron yield γ is determined directly by a current measurement method on the one hand and implicitly by the analysis of the electron emission statistics on the other hand. Successful measurements of the electron emission spectra ensure a deeper understanding of the ion induced kinetic electron emission process, with particular emphasis on the effect of the projectile cluster size to the yield as well as to emission statistics. The results allow a quantitative comparison to computer simulations performed for silver atoms and clusters impinging onto a silver surface.

Monte Carlo simulations of prompt-gamma emission during carbon ion irradiation

Energy Technology Data Exchange (ETDEWEB)

Le Foulher, F.; Bajard, M.; Chevallier, M.; Dauvergne, D.; Henriquet, P.; Ray, C.; Testa, E.; Testa, M. [Universite de Lyon 1, F-69003 Lyon (France); IN2P3/CNRS, UMR 5822, Institut de Physique Nucleaire de Lyon, F-69622 Villeurbanne (France); Freud, N.; Letang, J. M. [Laboratoire de Controles Non Destructifs Par Rayonnements Ionisants, INSA-Lyon, F-69621 Villeurbanne cedex (France); Karkar, S. [CPPM, Aix-Marseille Universite, CNRS/IN2P3, Marseille (France); Plescak, R.; Schardt, D. [Gesellschaft fur Schwerionenforschung (GSI), D-64291 Darmstadt (Germany)

2009-07-01

Monte Carlo simulations based on the Geant4 tool-kit (version 9.1) were performed to study the emission of secondary prompt gamma-rays produced by nuclear reactions during carbon ion-beam therapy. These simulations were performed along with an experimental program and instrumentation developments which aim at designing a prompt gamma-ray device for real-time control of hadron therapy. The objective of the present study is twofold: first, to present the features of the prompt gamma radiation in the case of carbon ion irradiation; secondly, to simulate the experimental setup and to compare measured and simulated counting rates corresponding to various experiments. For each experiment, we found that simulations overestimate prompt gamma-ray detection yields by a factor of 12. Uncertainties in fragmentation cross sections and binary cascade model cannot explain such discrepancies. The so-called 'photon evaporation' model is therefore questionable and its modification is currently in progress. (authors)

Mass spectrometric study of the negative and positive secondary ions emitted from ethanol microdroplets by MeV-energy heavy ion impact

Science.gov (United States)

Kitajima, Kensei; Majima, Takuya; Nishio, Tatsuya; Oonishi, Yoshiki; Mizutani, Shiori; Kohno, Jun-ya; Saito, Manabu; Tsuchida, Hidetsugu

2018-06-01

We have investigated the negative and positive secondary ions emitted from ethanol droplets by 4.0-MeV C3+ impact to reveal the characteristic features of the reaction processes induced by fast heavy ions at the liquid ethanol surface. Analysis of the secondary ions was performed by time-of-flight mass spectrometry for microdroplet targets in a high vacuum environment. Fragment ions, deprotonated cluster ions, and trace amounts of the reaction product ions are observed in the negative secondary ions. The main fragment anions are C2HmO- (m = 1, 3, and 5) and C2H- generated by loss of hydrogen and oxygen atoms. The reaction product anions include deprotonated glycols, larger alcohols, and their dehydrated and dehydrogenated forms generated by secondary reactions between fragments and radicals. Furthermore, C3Hm- (m = 0-2) and C4Hm- (m = 0 and 1) are observed, which could be produced through a plasma state generated in the heavy ion track. Deprotonated ethanol cluster ions, [(EtOH)n - H]-, are observed up to about n = 25. [(EtOH)n - H]- have smaller kinetic energies than the protonated cluster ions (EtOH)nH+. This probably represents the effect of the positive Coulomb potential transiently formed in the ion track. We also discuss the size distributions and structures of the water- and CH2OH-radical-attached ethanol cluster ions.

Simulation study of secondary electron images in scanning ion microscopy

CERN Document Server

Ohya, K

2003-01-01

The target atomic number, Z sub 2 , dependence of secondary electron yield is simulated by applying a Monte Carlo code for 17 species of metals bombarded by Ga ions and electrons in order to study the contrast difference between scanning ion microscopes (SIM) and scanning electron microscopes (SEM). In addition to the remarkable reversal of the Z sub 2 dependence between the Ga ion and electron bombardment, a fine structure, which is correlated to the density of the conduction band electrons in the metal, is calculated for both. The brightness changes of the secondary electron images in SIM and SEM are simulated using Au and Al surfaces adjacent to each other. The results indicate that the image contrast in SIM is much more sensitive to the material species and is clearer than that for SEM. The origin of the difference between SIM and SEM comes from the difference in the lateral distribution of secondary electrons excited within the escape depth.

Effect of energy selection on quantitative analysis in secondary ion microanalysis

International Nuclear Information System (INIS)

Steele, I.M.; Solberg, T.N.; Smith, J.V.; Clayton, R.N.; Hutcheon, I.D.

1977-01-01

Systematic change of voltage on the components of the secondary ion (SI) extraction system of our AEI-IM20 ion microprobe produced major changes of relative intensities of secondary ions passing through the mass spectrometer. The repeller, which bends the SI beam through about 60 0 , has the greatest effect, and can be used to plot the energy distribution. The extractor and the deflecting and focusing components have smaller but significant effects. Because low-energy secondary ions have a near-symmetrical distribution, whereas high-energy ones have an assymetric distribution favoring high energies, tuning of the acceptance band to higher energy reduces interference from low-energy ions, which tend to be unwanted molecular ions, at the expense of reduced transmission. Tuning to lower energy increases interference but gives higher transmission. The former condition is desirable for instruments restricted to low mass resolution, whereas both conditions are valuable for instruments adjustable for both high and low mass resolution. Other important factors are (a) sensitivity to surface irregularities which perturb SI energy collection, and (b) change in derived 'temperatures' from thermodynamic sputtering models merely from tuning the energy acceptance band. Careful attention to the above factors yielded reproducible SI ratios for the binary series of plagioclase feldspars. (Auth.)

Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)

Science.gov (United States)

Hervig, R. L.; Chen, J.; Schauer, S.; Stanley, B. D.; Moore, G. M.; Roggensack, K.

2012-12-01

In secondary ion mass spectrometry (SIMS), a sample is bombarded by a charged particle beam (the primary ion) and sputtered positive or negative secondary ions are analyzed in a mass spectrometer. When the target is not conducting (like many geological materials), sample charging can result in variable deflection of secondary ions away from the mass spectrometer and a low, unstable, or absent signal. Applying a thin conducting coat (e.g., C, Au) to polished samples is required, and if the primary ion beam is negatively-charged, the build-up of negative charge can be alleviated by secondary electrons draining to the conducting coat at the edge of the crater (if a positive potential is applied to the sample for the collection of positive secondary ions) or accelerated away from the crater (if a negative potential is applied for negative ion study). Unless the sputtered crater in the conducting coat becomes too large, sample charging can be kept at a controllable level, and high-quality trace element analyses and isotope ratios have been obtained using this technique over the past 3+ decades. When a positive primary beam is used, the resulting build-up of positive charge in the sample requires an electron gun to deliver sufficient negative charge to the sputtered crater. While there are many examples of successful analyses using this approach, the purpose of this presentation is to describe a very simple technique for aligning the electron gun on Cameca nf and 1270/80 SIMS instruments. This method allows reproducible analyses of insulating phases with a Cs+ primary beam and detection of negative secondary ions. Normally, the filament voltage on the E-gun is the same as the sample voltage; thus electrons do not strike the sample except when a positive charge has built up (e.g., in the analysis crater!). In this method, we decrease the sample voltage by 3 or more kV, so that the impact energy of the electrons is sufficient to induce a cathodoluminescent (CL) image on an

Ion-sound emission by Langmuir soliton reflected at density barrier

International Nuclear Information System (INIS)

El-Ashry, M.Y.

1989-07-01

The emission of ion-sound waves by an accelerated Langmuir soliton is studied. The acceleration of the soliton is due to an inhomogeneous density barrier. On the assumption that the kinetic energy of the Langmuir soliton is smaller than the potential energy created by the barrier. The basic equations describing the dynamic behaviour of the soliton and the emission of the ion-sound waves are formulated. The qualitative spatial distributions of the perturbed concentration in the ion-sound waves are analyzed at different characteristic points of the soliton. The energy lost by the soliton, as a result of the emission, is estimated. (author). 6 refs, 4 figs

An investigation of the mass spectra of secondary ions ejected from the single crystal surface of semiconductors

International Nuclear Information System (INIS)

Koval', A.G.; Mel'nikov, V.N.; Enukov, Yu.V.

1976-01-01

The mass spectra of secondary positive and negative ions, ejected by an Ar + ion beam from the (100) face of an epitaxial film of the semiconductor Alsub(x)Gasub(1-x)As were investigated. There are many various secondary ions in the mass spectrum under investigation. They may be divided into four groups according to their origins. Mass spectra of secondary positive and negative secondary ions differ much, either in their composition or the intensities of homogeneous ions. The I(T) dependences (I=the current of corresponding secondary ions, T=target temperature) were obtained for secondary and negative ions taken from groups differing by their origin. The I(T) dependences were obtained at several oxygen pressures in a chamber. For the ions with 'superficial' origin a strong dependence of their current on target temperature is observed. Oxygen pressure increase leads to substantial change of the I(T)curves. (Auth.)

Secondary Electron Emission Beam Loss Monitor for LHC

CERN Document Server

Dehning, B; Holzer, E B; Kramer, Daniel

2008-01-01

Beam Loss Monitoring (BLM) system is a vital part of the active protection of the LHC accelerators' elements. It should provide the number of particles lost from the primary hadron beam by measuring the radiation field induced by their interaction with matter surrounding the beam pipe. The LHC BLM system will use ionization chambers as standard detectors but in the areas where very high dose rates are expected, the Secondary Emission Monitor (SEM) chambers will be employed because of their high linearity, low sensitivity and fast response. The SEM needs a high vacuum for proper operation and has to be functional for up to 20 years, therefore all the components were designed according to the UHV requirements and a getter pump was included. The SEM electrodes are made of Ti because of its Secondary Emission Yield (SEY) stability. The sensitivity of the SEM was modeled in Geant4 via the Photo-Absorption Ionization module together with custom parameterization of the very low energy secondary electron production. ...

Depth resolution of secondary ion mass spectrometry

International Nuclear Information System (INIS)

Pustovit, A.N.

2004-01-01

The effect of the solid body discreteness in the direction of the normal to the sample surface on the depth resolution of the secondary ion mass spectrometry method is analyzed. It is shown that for this case the dependence of the width at the semi-height of the delta profiles of the studied elements depth distribution on the energy and angle of incidence of the initial ions should have the form of the stepwise function. This is experimentally proved by the silicon-germanium delta-layers in the silicon samples [ru

Charge transfer processes during ion scattering and stimulated desorption of secondary ions from gas-condensed dielectric surfaces

CERN Document Server

Souda, R

2002-01-01

The ion emission mechanism from weakly-interacting solid surfaces has been investigated. The H sup + ion captures a valence electron via transient chemisorption, so that the ion neutralization probability is related to the nature of bonding of adsorbates. The H sup + ion is scattered from physisorbed Ar at any coverage whereas the H sup + yield from solid H sub 2 O decays considerably due to covalency in the hydrogen bond. In electron- and ion-stimulated desorption, the ion ejection probability is correlated intimately with the physisorption/chemisorption of parent atoms or molecules. The emission of F sup + ions is rather exceptional because they arise from the screened F 2s core-hole state followed by the ionization via the intra-atomic Auger decay after bond breakage. In electron-stimulated desorption of H sub 2 O, hydrated protons are emitted effectively from nanoclusters formed on a solid Ar substrate due to Coulomb repulsion between confined valence holes.

Paradoxes of photoconductive target and optical control of secondary ion yield

International Nuclear Information System (INIS)

Rokakh, A. G.; Matasov, M. D.

2010-01-01

This study of the photoconductivity of semiconductors, in particular, cadmium chalcogenides as materials for targets of vacuum image converters followed the path of overcoming paradoxes. The concepts developed by the classics of photoelectricity also help to understand the paradoxes of the new secondary-ion photoelectric effect, especially, its spectral characteristic. The optical channel of secondary ion yield control via a photoconductive target opens the way to a new branch of nanotechnology, i.e., optoionics.

Multicolor tunable emission induced by Cu ion doping of perovskite zirconate

Energy Technology Data Exchange (ETDEWEB)

Lee, D.J. [Department of Physics, Soongsil University, Seoul 156-743 (Korea, Republic of); Lee, Y.S., E-mail: ylee@ssu.ac.kr [Department of Physics, Soongsil University, Seoul 156-743 (Korea, Republic of); Noh, H.-J. [Department of Physics, Chonnam National University, Gwangju 500-757 (Korea, Republic of)

2016-01-15

We report on a multicolor tunable emission induced by Cu ion doping of perovskite zirconate SrZrO{sub 3} with a fairly large bandgap (5.6 eV). X-ray photoelectron spectroscopy of our samples revealed the existence of two mixed valence states of the doped Cu ions, +1 and +2, with a ratio of 3:1. In photoluminescence excitation spectroscopy the absorption structures of the 3d states in monovalent Cu{sup +} and divalent Cu{sup 2+} were identified near 5 eV and 3.5 eV, respectively. Interestingly, in relation to the valence states of the Cu ions, the emission spectra depended strongly on the photo-excitation energy (E{sub ex}). For E{sub ex}<3.8 eV (UVA) two orange and green emissions were observed with the involvement of the Cu{sup 2+} state. For E{sub ex}>3.8 eV (UVB/UVC), however, the Cu{sup +} state, instead of the Cu{sup 2+} state, was dominant in the emission process, causing the visible emission to be turned into violet. Our results were indicative of the complementary role of the different Cu-ion valence states in a wide range of visible emission with respect to E{sub ex}. - Highlights: • Visible emission induced by the Cu doping of SrZrO3. • Tunable colors from orange to violet with respect to the photo-excitation energy. • Multicolor emission should be related to the mixed valence states of the doped Cu ions.

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

Science.gov (United States)

Martišíková, Mária; Jakubek, Jan; Granja, Carlos; Hartmann, Bernadette; Opálka, Lukáš; Pospíšil, Stanislav; Jäkel, Oliver

2011-11-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient`s condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2-30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

Measurement of secondary radiation during ion beam therapy with the pixel detector Timepix

International Nuclear Information System (INIS)

Martišíková, Mária; Hartmann, Bernadette; Jäkel, Oliver; Jakubek, Jan; Granja, Carlos; Opálka, Lukáš; Pospíšil, Stanislav

2011-01-01

In ion beam therapy the finite range of the ion beams in tissue and the presence of the Bragg-peak are exploited. Unpredictable changes in the patient's condition can alter the range of the ion beam in the body. Therefore it is desired to verify the actual ion range during the treatment, preferably in a non-invasive way. Positron emission tomography (PET) has been used successfully to monitor the applied dose distributions. This method however suffers from limited applicability and low detection efficiency. In order to increase the detection efficiency and to decrease the uncertainties, in this study we investigate the possibility to measure secondary charged particles emerging from the patient during irradiation. An initial experimental study to register the particle radiation coming out of a patient phantom during the therapy was performed at the Heidelberg Ion Beam Therapy Center (HIT) in Germany. A static narrowly-focused beam of carbon ions was directed into a head phantom. The emerging secondary radiation was measured with the position-sensitive Timepix detector outside of the phantom. The detector, developed by the Medipix Collaboration, consists of a silicon sensor bump bonded to a pixelated readout chip (256 × 256 pixels with 55 μm pitch). Together with the USB-based readout interface, Timepix can operate as an active nuclear emulsion registering single particles online with 2D-track visualization. In this contribution we measured the signal behind the head phantom and investigated its dependence on the beam energy (corresponding to beam range in water 2–30 cm). Furthermore, the response was measured at four angles between 0 and 90 degrees. At all investigated energies some signal was registered. Its pattern corresponds to ions. Differences in the total amount of signal for different beam energies were observed. The time-structure of the signal is correlated with that of the incoming beam, showing that we register products of prompt processes. Such

The influence of ion bombardment on emission properties of carbon materials

International Nuclear Information System (INIS)

Chepusov, Alexander; Komarskiy, Alexander; Kuznetsov, Vadim

2014-01-01

When electric-vacuum device works its cathode surface experiences bombardment with ions of residual gases. Effects of ion bombardment impact on surface of field emission cathodes made of carbon materials may essentially change emission properties of such cathodes. It changes emission start electric field strength, voltage vs. current characteristic of material, its relief and electron structure of the surface layer. Field emission cathode operating mode, variation of radiation doses allow to obtain both good effects: maximal electric current, surface recovery – and negative ones: the worst emission properties and surface destruction, amorphization.

The influence of ion bombardment on emission properties of carbon materials

Energy Technology Data Exchange (ETDEWEB)

Chepusov, Alexander, E-mail: chepusov@iep.uran.ru [The Institute of Electrophysics of the Ural Division of the Russian Academy of Sciences (IEP UD RAS), 620016, 106 Amundsen Street, Ekaterinburg (Russian Federation); Ural Federal University, 620002, 19 Mira Street, Ekaterinburg (Russian Federation); Komarskiy, Alexander, E-mail: aakomarskiy@gmail.com [The Institute of Electrophysics of the Ural Division of the Russian Academy of Sciences (IEP UD RAS), 620016, 106 Amundsen Street, Ekaterinburg (Russian Federation); Ural Federal University, 620002, 19 Mira Street, Ekaterinburg (Russian Federation); Kuznetsov, Vadim, E-mail: kuznetsov@iep.uran.ru [The Institute of Electrophysics of the Ural Division of the Russian Academy of Sciences (IEP UD RAS), 620016, 106 Amundsen Street, Ekaterinburg (Russian Federation)

2014-07-01

When electric-vacuum device works its cathode surface experiences bombardment with ions of residual gases. Effects of ion bombardment impact on surface of field emission cathodes made of carbon materials may essentially change emission properties of such cathodes. It changes emission start electric field strength, voltage vs. current characteristic of material, its relief and electron structure of the surface layer. Field emission cathode operating mode, variation of radiation doses allow to obtain both good effects: maximal electric current, surface recovery – and negative ones: the worst emission properties and surface destruction, amorphization.

Secondary Ion Mass Spectrometry SIMS XI

Science.gov (United States)

Gillen, G.; Lareau, R.; Bennett, J.; Stevie, F.

2003-05-01

This volume contains 252 contributions presented as plenary, invited and contributed poster and oral presentations at the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS XI) held at the Hilton Hotel, Walt Disney World Village, Orlando, Florida, 7 12 September, 1997. The book covers a diverse range of research, reflecting the rapid growth in advanced semiconductor characterization, ultra shallow depth profiling, TOF-SIMS and the new areas in which SIMS techniques are being used, for example in biological sciences and organic surface characterization. Papers are presented under the following categories: Isotopic SIMS Biological SIMS Semiconductor Characterization Techniques and Applications Ultra Shallow Depth Profiling Depth Profiling Fundamental/Modelling and Diffusion Sputter-Induced Topography Fundamentals of Molecular Desorption Organic Materials Practical TOF-SIMS Polyatomic Primary Ions Materials/Surface Analysis Postionization Instrumentation Geological SIMS Imaging Fundamentals of Sputtering Ion Formation and Cluster Formation Quantitative Analysis Environmental/Particle Characterization Related Techniques These proceedings provide an invaluable source of reference for both newcomers to the field and experienced SIMS users.

Secondary Electron Emission Materials for Transmission Dynodes in Novel Photomultipliers: A Review

Directory of Open Access Journals (Sweden)

Shu Xia Tao

2016-12-01

Full Text Available Secondary electron emission materials are reviewed with the aim of providing guidelines for the future development of novel transmission dynodes. Materials with reflection secondary electron yield higher than three and transmission secondary electron yield higher than one are tabulated for easy reference. Generations of transmission dynodes are listed in the order of the invention time with a special focus on the most recent atomic-layer-deposition synthesized transmission dynodes. Based on the knowledge gained from the survey of secondary election emission materials with high secondary electron yield, an outlook of possible improvements upon the state-of-the-art transmission dynodes is provided.

Electron-emission processes in highly charged Ar and Xe ions impinging on highly ordered pyrolytic graphite at energies just above the kinetic threshold

NARCIS (Netherlands)

Bodewits, E.; Hoekstra, R.; Dobes, K.; Aumayr, F.

2014-01-01

At keV energies, many electronic processes contribute to the emission of secondary electrons in the interaction of highly charged ions on surfaces. To unravel contributions resulting from isolated hollow atoms in front of the surface or embedded in the electron gas of the target, heavy highly

Aspects of quantitative secondary ion mass spectrometry

International Nuclear Information System (INIS)

Grauer, R.

1982-05-01

Parameters which have an influence on the formation of secondary ions by ion bombardment of a solid matrix are discussed. Quantitative SIMS-analysis with the help of calibration standards necessitates a stringent control of these parameters. This is particularly valid for the oxygen partial pressure which for metal analysis has to be maintained constant also under ultra high vacuum. The performance of the theoretical LTE-model (Local Thermal Equilibrium) using internal standards will be compared with the analysis with the help of external standards. The LTE-model does not satisfy the requirements for quantitative analysis. (Auth.)

Measurement of electron emission due to energetic ion bombardment in plasma source ion implantation

Science.gov (United States)

Shamim, M. M.; Scheuer, J. T.; Fetherston, R. P.; Conrad, J. R.

1991-11-01

An experimental procedure has been developed to measure electron emission due to energetic ion bombardment during plasma source ion implantation. Spherical targets of copper, stainless steel, graphite, titanium alloy, and aluminum alloy were biased negatively to 20, 30, and 40 kV in argon and nitrogen plasmas. A Langmuir probe was used to detect the propagating sheath edge and a Rogowski transformer was used to measure the current to the target. The measurements of electron emission coefficients compare well with those measured under similar conditions.

Ion-induced electron emission from clean metals

International Nuclear Information System (INIS)

Baragiola, R.A.; Alonso, E.V.; Ferron, J.; Oliva-Florio, A.; Universidad Nacional de Cuyo, San Carlos de Bariloche

1979-01-01

We report recent experimental work on electron emission from clean polycrystalline metal surfaces under ion bombardment. We critically discuss existing theories and point out the presently unsolved problems. (orig.)

Monte Carlo calculation of secondary electron emission from carbon-surface by obliquely incident particles

International Nuclear Information System (INIS)

Ohya, Kaoru; Kawata, Jun; Mori, Ichiro

1990-01-01

Incidence angle dependences of secondary electron emission from a carbon surface by low energy electron and hydrogen atom are calculated using Monte Carlo simulations on the kinetic emission model. The calculation shows very small increase or rather decrease of the secondary electron yield with oblique incidence. It is explained in terms of not only multiple elastic collisions of incident particles with the carbon atoms but also small penetration depth of the particles comparable with the escape depth of secondary electrons. In addition, the two types of secondary electron emission are distinguished by using the secondary electron yield statistics; one is the emission due to trapped particles in the carbon, and the other is that due to backscattered particles. The high-yield component of the statistics on oblique incidence is more suppressed than those on normal incidence. (author)

Interpretation of ion cyclotron emission from fusion and space plasmas

International Nuclear Information System (INIS)

Dendy, R.O.

1994-01-01

Superthermal ion cyclotron emission (ICE) is observed in both fusion and space plasma. Typical spectra display strong peaks at sequential multiple ion cyclotron harmonics, and distinct energetic ion populations are present in the emitting regions. In JET and TFTR, for example, ICE appears to be driven by fusion products or by injected beam ions in the outer mid plane; and in the Earth's ring current, radiation belts, and bow shock, ICE has been observed by the spacecraft OGO 3, GEOS 1 and 2 and AMPTE/IRM, often in conjunction with highly non-Maxwellian proton populations. Common emission mechanisms, arising from collective relaxation of energetic ion populations, appear to operate in both the fusion and space plasma environments. These are reviewed here, and the potential role of ICE as a diagnostic of energetic ion populations is also examined. (Author)

Secondary ions produced from condensed rare gas targets under highly charged MeV/amu heavy ion bombardment

International Nuclear Information System (INIS)

Tawara, H.; Tonuma, T.; Kumagai, H.; Matsuo, T.

1994-01-01

Secondary ions produced from condensed rare gas targets are observed under MeV/amu, highly charged, heavy ion impact. The intensities of the observed cluster ions decrease smoothly as the cluster sizes become large but show some discontinuities at particular sizes of cluster ions. This seems to be closely related to the stabilities of cluster ion structures. It is also noted that very few doubly charged or practically no triply/higher charged ions have been observed, in sharp contrast to that of some condensed molecular targets. (orig.)

The effect of work function changes on secondary ion energy spectra

International Nuclear Information System (INIS)

Wittmaack, K.

1983-01-01

The effect of work function changes on experimental secondary ion energy spectra is discussed. In agreement with theory the measured ion intensities frequently exhibit an exponential work function dependence. However, the predicted velocity dependence is only observed at fairly high secondary ion energies. In the absence of a velocity dependence of the degree of ionization measured shifts of energy spectra reflect work function changes directly. Various instrumental problems are shown to aggravate a detailed comparison between experiment and theory. Significant artefacts must be expected if the extraction field is of the order of or less than the lateral field induced by a work function difference between the bombarded spot and the surrounding sample surface. (Auth.)

Film sputtering with ion mixing in a pulse explosion-emission ion diode

International Nuclear Information System (INIS)

Korenev, S.A.; Balalykin, N.I.; Sikolenko, V.V.; Orelovich, O.L.; Shirokov, D.M.

1995-01-01

A possibility is confirmed of obtaining mixed composition films from mutually nonsoluble metals in conditions when a film is irradiated with an ion beam in the process of deposition and afterwards with an electron beam. In the experiments was used an explosion-emission ion diode. The experiments showed a possibility of obtaining a new structural material-aluminium with titanium film. 12 refs.; 7 figs.; 1 tab

Electron emission from solids induced by swift heavy ions

International Nuclear Information System (INIS)

Xiao Guoqing

2000-01-01

The recent progresses in experimental and theoretical studies of the collision between swift heavy ion and solids as well as electron emission induced by swift heavy ion in solids were briefly reviewed. Three models, Coulomb explosion, thermal spike and repulsive long-lived states, for interpreting the atomic displacements stimulated by the electronic energy loss were discussed. The experimental setup and methods for measuring the electron emission from solids were described. The signification deviation from a proportionality between total electron emission yields and electronic stopping power was found. Auger-electron and convoy-electron spectra are thought to be a probe for investigating the microscopic production mechanisms of the electronic irradiation-damage. Electron temperature and track potential at the center of nuclear tracks in C and polypropylene foils induced by 5 MeV/u heavy ions, which are related to the electronic excitation density in metals and insulators respectively, were extracted by measuring the high resolution electron spectra

On novel mechanisms of slow ion induced electron emission

International Nuclear Information System (INIS)

Eder, H.

2000-09-01

The present work has contributed in new ways to the field of slow ion induced electron emission. First, measurements of the total electron yield γ for impact of slow singly and multiply charged ions on atomically clean polycrystalline gold and graphite have been made. The respective yields were determined by current measurements and measurements of the electron number statistics. A new mechanism for kinetic emission (KE) below the so called 'classical threshold' was found and discussed. For a given ion species and impact velocity a slight decrease of the yields was found for ion charge state q = 1 toward 3, but no significant differences in KE yields for higher q values. Comparison of the results from gold and graphite showed overall similar behavior, but for C+ a relatively strong difference was observed and ascribed to more effective electron promotion in the C-C- than in the C-Au system. Secondly, for the very specific system H0 on LiF we investigated single electron excitation processes under grazing incidence conditions. In this way long-range interactions of hydrogen atoms with the ionic crystal surface could be probed. Position- and velocity-dependent electron production rates were found which indicate that an electron promotion mechanism is responsible for the observed electron emission. Thirdly, in order to investigate the importance of plasmon excitation and -decay in slow ion induced electron emission, measurements of electron energy distributions from impact of singly and doubly charged ions on poly- and monocrystalline aluminum surfaces were performed. From the results we conclude that direct plasmon excitation by slow ions occurs due to the potential energy of the projectile in a quasi-resonant fashion. The highest relative plasmon intensities were found for impact of 5 keV Ne+ on Al(111) with 5 % of the total yield. For impact of H + and H 2 + characteristical differences were observed for Al(111) and polycrystalline aluminum. We show that

Delta-electron emission in fast heavy ion atom collisions

International Nuclear Information System (INIS)

Schmidt-Boecking, H.; Ramm, U.; Berg, H.; Kelbch, C.; Feng Jiazhen; Hagmann, S.; Kraft, G.; Ullrich, J.

1991-01-01

The δ-electron emission processes occuring in fast heavy ion atom collisons are explained qualitatively. The different spectral structures of electron emission arising from either the target or the projectile are explained in terms of simple models of the kinetics of momentum transfer induced by the COULOMB forces. In collisions of very heavy ions with matter, high nuclear COULOMB forces are created. These forces lead to a strong polarization of the electronic states of the participated electrons. The effects of this polarization are discussed. (orig.)

Proposal for secondary ion beams and update of data taking schedule for 2009-2013

CERN Document Server

Abgrall, N; Andrieu, B; Anticic, T; Antoniou, N; Argyriades, J; Asryan, A G; Baatar, B; Blondel, A; Blumer, J; Boldizsar, L; Bravar, A; Brzychczyk, J; Bunyatov, S A; Choi, K U; Christakoglou, P; Chung, P; Cleymans, J; Derkach, D A; Diakonos, F; Dominik, W; Dumarchez, J; Engel, R; Ereditato, A; Feofilov, G A; Ferrero, A; Fodor, Z; Gazdzicki, M; Golubeva, M; Grebieszkow, K; Guber, F; Hasegawa, T; Haungs, A; Hess, M; Igolkin, S; Ivanov, A S; Ivashkin, A; Kadija, K; Katrynska, N; Kielczewska, D; Kikola, D; Kim, J H; Kobayashi, T; Kolesnikov, V I; Kolev, D; Kolevatov, R S; Kondratiev, V P; Kurepin, A; Lacey, R; Laszlo, A; Lehmann, S; Lungwitz, B; Lyubushkin, V V; Maevskaya, A; Majka, Z; Malakhov, A I; Marchionni, A; Marcinek, A; Maris, I; Matveev, V; Melkumov, G L; Meregaglia, A; Messina, M; Meurer, C; Mijakowski, P; Mitrovski, M; Montaruli, T; Mrówczynski, St; Murphy, S; Nakadaira, T; Naumenko, P A; Nikolic, V; Nishikawa, K; Palczewski, T; Pálla, G; Panagiotou, A D; Peryt, W; Petridis, A; Planeta, R; Pluta, J; Popov, B A; Posiadala, M; Przewlocki, P; Rauch, W; Ravonel, M; Renfordt, R; Röhrich, D; Rondio, E; Rossi, B; Roth, M; Rubbia, A; Rybczynski, M; Sadovskii, A; Sakashita, K; Schuster, T; Sekiguchi, T; Seyboth, P; Shileev, K; Sissakian, A N; Skrzypczak, E; Slodkowski, M; Sorin, A S; Staszel, P; Stefanek, G; Stepaniak, J; Strabel, C; Ströbele, H; Susa, T; Szentpétery, I; Szuba, M; Taranenko, A; Tsenov, R; Ulrich, R; Unger, M; Vassiliou, M; Vechernin, V V; Vesztergombi, G; Wlodarczyk, Z; Wojtaszek, A; Yi, J G; Yoo, I K; CERN. Geneva. SPS and PS Experiments Committee; SPSC

2009-01-01

This document presents the proposal for secondary ion beams and the updated data taking schedule of the NA61 Collaboration. The modification of the original NA61 plans is necessary in order to reach compatibility between the current I-LHC and NA61 schedules. It assumes delivery of primary proton beam in 2009-2012 and of primary lead beam in 2011-2013. The primary lead beam will be fragmented into a secondary beam of lighter ions. The modified H2 beam line will serve as a fragment separator to produce the light ion species for NA61 data taking. The expected physics performance of the NA61 experiment with secondary ion beams will be sufficient to reach the primary NA61 physics goals.

Directional Secondary Emission of a Semiconductor Microcavity

DEFF Research Database (Denmark)

Langbein, Wolfgang; Jensen, Jacob Riis; Hvam, Jørn Märcher

2000-01-01

We investigate the time-resolved secondary emission of a homogeneously broadened microcavity after resonant excitation. The sample consists of a 25nm GaAs single quantum well (QW) in the center of a wedged ¥ë cavity with AlAs/AlGaAs Bragg reflectors, grown by molecular beam epitaxy. At zero detun...

An experimental assessment of proposed universal yield curves for secondary electron emission

International Nuclear Information System (INIS)

Salehi, M.; Flinn, E.A.

1980-01-01

A variety of 'Universal Yield Curves' for the secondary emission process have been proposed. A series of precise measurements of the secondary emission properties of a range of related amorphous semiconducting materials, made under UHV on freshly vacuum-cleaved surfaces, and covering a wide range of primary energies, have recently made possible an accurate assessment of the validity of the various UYC's suggested. It is found that no truly universal curve exists; the atomic number of the target material plays an important part in determining the secondary emission properties. Agarwal's (Proc. Phys. Soc.; 71: 851 (1958)) semi-empirical expression, which takes account of the atomic number and weight, is found to give good agreement for all the materials studied. Further theoretical investigation is required. (author)

Secondary emission monitor (SEM) grids.

CERN Multimedia

Patrice Loïez

2002-01-01

A great variety of Secondary Emission Monitors (SEM) are used all over the PS Complex. At other accelerators they are also called wire-grids, harps, etc. They are used to measure beam density profiles (from which beam size and emittance can be derived) in single-pass locations (not on circulating beams). Top left: two individual wire-planes. Top right: a combination of a horizontal and a vertical wire plane. Bottom left: a ribbon grid in its frame, with connecting wires. Bottom right: a SEM-grid with its insertion/retraction mechanism.

Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding

Science.gov (United States)

Wittmaack, Klaus

2013-03-01

departing atom is shifted below (above) the Fermi level. Ion yields should be controlled by the work function (WF) of the sample, Φ, and the normal velocity of the ejected ions. To explore the predicted velocity dependence, the performance characteristics of the employed SIMS instrument need to be known. The Cs induced negative-ion yield enhancement observed with pure metal and alloy targets often exceeded five orders of magnitude, with enhancement factors essentially independent of the emission energy. This absence of a velocity dependence is at variance with the predictions of the tunnelling model. Previous theoretical attempts to model the Φ-dependence and the apparent velocity effect for the overrated case of O-emission from Li and Cs exposed oxidised metal surfaces must be considered a meander. The experimental data, recorded with a quadrupole based instrument of inadequate extraction geometry, may alternatively be rationalised in terms of alkali induced changes in the energy spectrum of sputtered atoms. Another important finding is that secondary ion yield changes do not correlate with the absolute magnitude of the (macroscopic) WF but often with WF changes, ΔΦ. The frequently used method of determining ΔΦ in situ from the shift of the leading edge of secondary ion energy spectra rests on the assumption, taken for granted or not even appreciated, that Cs induced yield changes are independent of the ion's emission velocity. Hence the approach is only applicable if the tunnelling model is not valid. The local character of alkali induced WF changes, which might provide a route to an understanding of previously unexplained phenomena, has been explored using photoemission of adsorbed inert gases, scanning tunneling microscopy and low-energy ion scattering spectrometry. At room temperature, the Cs coverage is limited to one layer of adatoms. Close similarities are identified between WF changes generated by Cs vapour deposition and by bombardment with Cs ions. This

Monte Carlo modeling of ion beam induced secondary electrons

Energy Technology Data Exchange (ETDEWEB)

Huh, U., E-mail: uhuh@vols.utk.edu [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Cho, W. [Electrical and Computer Engineering, University of Tennessee, Knoxville, TN 37996-2100 (United States); Joy, D.C. [Biochemistry & Cellular & Molecular Biology, University of Tennessee, Knoxville, TN 37996-0840 (United States); Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)

2016-09-15

Ion induced secondary electrons (iSE) can produce high-resolution images ranging from a few eV to 100 keV over a wide range of materials. The interpretation of such images requires knowledge of the secondary electron yields (iSE δ) for each of the elements and materials present and as a function of the incident beam energy. Experimental data for helium ions are currently limited to 40 elements and six compounds while other ions are not well represented. To overcome this limitation, we propose a simple procedure based on the comprehensive work of Berger et al. Here we show that between the energy range of 10–100 keV the Berger et al. data for elements and compounds can be accurately represented by a single universal curve. The agreement between the limited experimental data that is available and the predictive model is good, and has been found to provide reliable yield data for a wide range of elements and compounds. - Highlights: • The Universal ASTAR Yield Curve was derived from data recently published by NIST. • IONiSE incorporated with the Curve will predict iSE yield for elements and compounds. • This approach can also handle other ion beams by changing basic scattering profile.

Molecular effects in ion-electron emission from clean metal surfaces

International Nuclear Information System (INIS)

Baragiola, R.A.; Alonso, E.V.; Auciello, O.; Ferron, J.; Lantschner, G.; Oliva Florio, A.

1978-01-01

The authors have measured electron emission yields from clean Al, Cu and Ag under 2-50 keV H + , D + , H 2 + impact. It is found that molecular ion yields are lower than twice the yield of atomic ions. No isotope effects are observed for equal-velocity ions. (Auth.)

Visualization of metallodrugs in single cells by secondary ion mass spectrometry imaging.

Science.gov (United States)

Wu, Kui; Jia, Feifei; Zheng, Wei; Luo, Qun; Zhao, Yao; Wang, Fuyi

2017-07-01

Secondary ion mass spectrometry, including nanoscale secondary ion mass spectrometry (NanoSIMS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS), has emerged as a powerful tool for biological imaging, especially for single cell imaging. SIMS imaging can provide information on subcellular distribution of endogenous and exogenous chemicals, including metallodrugs, from membrane through to cytoplasm and nucleus without labeling, and with high spatial resolution and chemical specificity. In this mini-review, we summarize recent progress in the field of SIMS imaging, particularly in the characterization of the subcellular distribution of metallodrugs. We anticipate that the SIMS imaging method will be widely applied to visualize subcellular distributions of drugs and drug candidates in single cells, exerting significant influence on early drug evaluation and metabolism in medicinal and pharmaceutical chemistry. Recent progress of SIMS applications in characterizing the subcellular distributions of metallodrugs was summarized.

Primary Emission and the Potential of Secondary Aerosol Formation from Chinese Gasoline Engine Exhaust

Science.gov (United States)

Hu, Min; Peng, Jianfei; Qin, Yanhong; Du, Zhuofei; Li, Mengjin; Zheng, Rong; Zheng, Jing; Shang, Dongjie; Lu, Sihua; Wu, Yusheng; Zeng, Limin; Guo, Song; Shao, Min; Wang, Yinhui; Shuai, Shijin

2017-04-01

Along with the urbanization and economic growth, vehicle population in China reached 269 million, ranked the second in the world in 2015. Gasoline vehicle is identified to be the main source for urban PM2.5 in China, accounting for 15%-31%. In this study the impact of fuel components on PM2.5 and volatile organic compounds (VOCs) emissions from a gasoline port fuel injection (PFI) engine and a gasoline direct injection (GDI) engine are discussed. Results show that, higher proportion of aromatics, alkenes or sulfur in gasoline fuel will lead to higher PM emissions. The PM from the PFI engine mainly consists of OC and a small amount of EC and inorganic ions, while the PM discharge from the GDI engine mainly consists of EC, OM and a small amount of inorganic ions. Since the GDI engines can reduce fuel consumption and CO2 emissions, and it would become more and more popular in the near future. The characteristics of POM component, emission factors and source profile were investigated from GDI engine, particularly focused on the effect of engine speed, load and the catalyst, which will be very much helpful for source identification as source indicators. Chamber experiments were conducted to quantify the potential of secondary aerosol formation from exhaust of a PFI gasoline engine and China V gasoline fuel. During 4-5 h simulation, equivalent to10 days of atmospheric photo-oxidation in Beijing, the extreme SOA production was 426 ± 85 mg/kg fuel, with high precursors and OH exposure. 14% of SOA measured in the chamber experiments could be explained through the oxidation of speciated single-ring aromatics. Unspeciated precursors, such as intermediate-volatility organic compounds and semi-volatility organic compounds, might be significant for SOA formation from gasoline VOCs. We concluded that reduction of emissions of aerosol precursor gases from vehicles is essential to mediate pollution in China.

The collision of a hypervelocity massive projectile with free-standing graphene: Investigation of secondary ion emission and projectile fragmentation

Science.gov (United States)

Geng, Sheng; Verkhoturov, Stanislav V.; Eller, Michael J.; Della-Negra, Serge; Schweikert, Emile A.

2017-02-01

We present here the study of the individual hypervelocity massive projectiles (440-540 keV, 33-36 km/s Au4004+ cluster) impact on 1-layer free-standing graphene. The secondary ions were detected and recorded separately from each individual impact in the transmission direction using a time-of-flight mass spectrometer. We observed C1-10± ions emitted from graphene, the projectiles which penetrated the graphene, and the Au1-3± fragment ions in mass spectra. During the projectile-graphene interaction, the projectile loses ˜15% of its initial kinetic energy (˜0.18 keV/atom, 72 keV/projectile). The Au projectiles are neutralized when approaching the graphene and then partially ionized again via electron tunneling from the hot rims of the holes on graphene, obtaining positive and negative charges. The projectile reaches an internal energy of ˜450-500 eV (˜4400-4900 K) after the impact and then undergoes a ˜90-100 step fragmentation with the ejection of Au1 atoms in the experimental time range of ˜0.1 μs.

Intrinsic Lead Ion Emissions in Zero-Dimensional Cs4PbBr6 Nanocrystals

KAUST Repository

Yin, Jun

2017-11-07

We investigate the intrinsic lead ion (Pb2+) emissions in zero-dimensional (0D) perovskite nanocrystals (NCs) using a combination of experimental and theoretical approaches. The temperature-dependent photoluminescence experiments for both “nonemissive” (highly suppressed green emission) and emissive (bright green emission) Cs4PbBr6 NCs show a splitting of emission spectra into high- and low-energy transitions in the ultraviolet (UV) spectral range. In the nonemissive case, we attribute the high-energy UV emission at approximately 350 nm to the allowed optical transition of 3P1 to 1S0 in Pb2+ ions and the low-energy UV emission at approximately 400 nm to the charge-transfer state involved in the 0D NC host lattice (D-state). In the emissive Cs4PbBr6 NCs, in addition to the broad UV emission, we demonstrate that energy transfer occurs from Pb2+ ions to green luminescent centers. The optical phonon modes in Cs4PbBr6 NCs can be assigned to both Pb–Br stretching and rocking motions from density functional theory calculations. Our results address the origin of the dual broadband Pb2+ ion emissions observed in Cs4PbBr6 NCs and provide insights into the mechanism of ionic exciton–optical phonon interactions in these 0D perovskites.

Variation in emission and energy recovery concerning incident angle in a scheme recovering high energy ions by secondary electrons

International Nuclear Information System (INIS)

Wada, Takayuki; Konno, Shota; Nakamoto, Satoshi; Takeno, Hiromasa; Furuyama, Yuichi; Taniike, Akira

2016-01-01

As an energy recovery device for fast protons produced in D- 3 He nuclear fusion, secondary electron (SE) direct energy converter (SEDEC) was proposed in addition to traveling wave direct energy converter (TWDEC). Some protons passing through a TWDEC come into an SEDEC, where protons penetrate to a number of foil electrodes and emitted SEs are recovered. Following to a development of SE orbit control by magnetic field, dependence on incident angle of protons was examined to optimize structure of SEDEC. Based on a theoretical expectation, experiments were performed by changing incident angle of protons and variation in emission and energy recovery were measured. Both emission and energy recovery increased as the angle increased, and differences with theoretical expectation are discussed. (author)

(n,p) emission channeling measurements on ion-implanted beryllium

CERN Multimedia

Jakubek, J; Uher, J

2007-01-01

We propose to perform emission-channeling measurements using thermal neutron induced proton emission from ion-implanted $^{7}$Be. The physics questions addressed concern the beryllium doping of III-V and II-VI semiconductors and the host dependence of the electron capture half-life of $^{7}$Be.

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Science.gov (United States)

Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

2018-02-01

A procedure has been established to define the interface position in depth profiles accurately when using secondary ion mass spectrometry and the negative secondary ions. The interface position varies strongly with the extent of the matrix effect and so depends on the secondary ion measured. Intensity profiles have been measured at both fluorenylmethyloxycarbonyl-uc(l)-pentafluorophenylalanine (FMOC) to Irganox 1010 and Irganox 1010 to FMOC interfaces for many secondary ions. These profiles show separations of the two interfaces that vary over some 10 nm depending on the secondary ion selected. The shapes of these profiles are strongly governed by matrix effects, slightly weakened by a long wavelength roughening. The matrix effects are separately measured using homogeneous, known mixtures of these two materials. Removal of the matrix and roughening effects give consistent compositional profiles for all ions that are described by an integrated exponentially modified Gaussian (EMG) profile. Use of a simple integrated Gaussian may lead to significant errors. The average interface positions in the compositional profiles are determined to standard uncertainties of 0.19 and 0.14 nm, respectively, using the integrated EMG function. Alternatively, and more simply, it is shown that interface positions and profiles may be deduced from data for several secondary ions with measured matrix factors by simply extrapolating the result to Ξ = 0. Care must be taken in quoting interface resolutions since those measured for predominantly Gaussian interfaces with Ξ above or below zero, without correction, appear significantly better than the true resolution.

High-stable secondary-emission monitor for accelerated electron beam current

International Nuclear Information System (INIS)

Prudnikov, I.A.; Saksaganskij, G.L.; Bazhanov, E.B.; Zabrodin, B.V.

1977-01-01

A secondary-emission monitor for a 10 to 30 MeV electron beam (beam current is 10 -4 to 10 -2 A) is described. The monitor comprises a measuring electrode unit, titanium discharge-type pump, getter made of porous titanium, all enclosed in a metal casing. The measuring unit comprises three electrodes made of 20 μm aluminium foil. The secondary emission coefficient (5.19%+-0.06% for the electron energy of 20 MeV) is maintained stable for a long time. The monitor detects pulses of up to some nanoseconds duration. It is reliable in operation, and is recommended for a wide practical application

90 deg.Neutron emission from high energy protons and lead ions on a thin lead target

CERN Document Server

Agosteo, S; Foglio-Para, A; Mitaroff, W A; Silari, Marco; Ulrici, L

2002-01-01

The neutron emission from a relatively thin lead target bombarded by beams of high energy protons/pions and lead ions was measured at CERN in one of the secondary beam lines of the Super Proton Synchrotron for radiation protection and shielding calculations. Measurements were performed with three different beams: sup 2 sup 0 sup 8 Pb sup 8 sup 2 sup + lead ions at 40 GeV/c per nucleon and 158 GeV/c per nucleon, and 40 GeV/c mixed protons/pions. The neutron yield and spectral fluence per incident ion on target were measured at 90 deg.with respect to beam direction. Monte-Carlo simulations with the FLUKA code were performed for the case of protons and pions and the results found in good agreement with the experimental data. A comparison between simulations and experiment for protons, pions and lead ions have shown that--for such high energy heavy ion beams--a reasonable estimate can be carried out by scaling the result of a Monte-Carlo calculation for protons by the projectile mass number to the power of 0.80-0...

Ion-induced emission of charged particles from solid hydrogen and deuterium

International Nuclear Information System (INIS)

Borgesen, P.; Schou, J.; Sorensen, H.

1980-01-01

Measurements have been made of the emission of both positive and negative particles from solid hydrogen and deuterium for normal incidence of H + , H + 2 , H + 3 , D 2 H + , D + 3 and He + ions up to 10 keV. For positive particles the emission coefficient increased with increasing energy of incidence to reach a value of 0.08 per atom for 10 keV H + onto hydrogen. Apparently the positive particles are sputtered ones. The negative particles emitted are predominantly electrons. The emission coefficient per incident atom as a function of the velocity of the incident particle agress fairly well with results published earlier for incidence of hydrogen and deuterium ions. However, systematic differences of up to 10% are now observed between the coefficients for the different types of ions. (orig.)

Alpha spectrometry and secondary ion mass spectrometry of thorium

International Nuclear Information System (INIS)

Strisovska, Jana; Kuruc, Jozef; Galanda, Dusan; Matel, Lubomir; Velic, Dusan; Aranyosiova, Monika

2009-01-01

A sample of thorium content on steel discs was prepared by electrodeposition with a view to determining the natural thorium isotope. Thorium was determined by alpha spectrometry and by secondary ion mass spectrometry and the results of the two methods were compared

On the regularities of gamma-ray initiated emission of really-secondary electrons

International Nuclear Information System (INIS)

Grudskij, M.Ya.; Roldugin, N.N.; Smirnov, V.V.

1982-01-01

Emission regularities of the really-secondary electrons from metals are discussed on the basis of experimental data on electron emission characteristics under gamma radiation of incident quanta produced for a wide energy range (Esub(γ)=0.03+-2 MeV) and atomic numbers of target materials (Z=13+-79). Comparison with published experimental and calculated data is performed. It is shown that yield of the really-secondary electrons into vacuum from the target surface bombarded with a normally incident collimated beam of gamma radiation calculating on energy unit absorbed in the yield zone of the really-secondary electrons is determined only with the target material emittivity and can be calculated if spatial-energy distributions and the number of secondary fast electrons emitted out of the target are known

Surface potential measurement of negative-ion-implanted insulators by analysing secondary electron energy distribution

International Nuclear Information System (INIS)

Toyota, Yoshitaka; Tsuji, Hiroshi; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki.

1994-01-01

The negative ion implantation method we have proposed is a noble technique which can reduce surface charging of isolated electrodes by a large margin. In this paper, the way to specify the surface potential of negative-ion-implanted insulators by the secondary electron energy analysis is described. The secondary electron energy distribution is obtained by a retarding field type energy analyzer. The result shows that the surface potential of fused quartz by negative-ion implantation (C - with the energy of 10 keV to 40 keV) is negatively charged by only several volts. This surface potential is extremely low compared with that by positive-ion implantation. Therefore, the negative-ion implantation is a very effective method for charge-up free implantation without charge compensation. (author)

Process control with optical emission spectroscopy in triode ion plating

International Nuclear Information System (INIS)

Salmenoja, K.; Korhonen, A.S.; Sulonen, M.S.

1985-01-01

Physical vapor deposition (PVD) techniques used to prepare, e.g., hard TiN, HfN, or ZrN coatings include a great variety of processes ranging from reactive evaporation to sputtering and ion plating. In ion plating one effective way to enhance ionization is to use a negatively biased hot filament. The use of an electron emitting filament brings an extra variable to be taken into account in developing the process control. In addition, proper control of the evaporation source is critical in ensuring reproducible results. With optical emission spectroscopy (OES) it should be possible to control the coating process more accurately. The stoichiometry and the composition of the growing coating may then be ensured effectively in subsequent runs. In this work the application of optical emission spectroscopy for process control in triode ion plating is discussed. The composition of the growing coating is determined experimentally using the relative intensities of specific emission lines. Changes in the evaporation rate and the gas flow can be seen directly from emission line intensities. Even the so-called poisoning of the evaporation source with reactive gas can be detected. Several experimental runs were carried out and afterwards the concentration profiles of the deposited coatings were checked with the nuclear resonance broadening (NRB) method. The results show the usefulness of emission spectroscopy in discharge control

Investigation of metal ions in fusion plasmas using emission spectroscopy

International Nuclear Information System (INIS)

Tale, I.

2005-01-01

Full text: The Latvian and Portugal Associations are performing development of advanced plasma - facing system using the liquid metal limiter. The objectives of this project require study of the influence of the liquid metal limiter on the main plasma parameters, including concentration of evaporated metal atoms in plasma. The fusion plasmas are related to the dense hot plasmas. The required average ion temperature according to the ITER project (International Thermonuclear Experimental Reactor) is 8,0 keV (9,3 x 10 7 0 K), the average electron temperature - 8,9 keV (1,04 x 10 8 0 K). Plasma temperature operated in the research tokamak ISSTOK, involved in testing of liquid metal limiter concept is considerably less, being of order of 10 50 K. The ionization degree of metal atoms considerably depends on the plasma ion temperature. Density of metal vapours in plasma can be estimated using the following two spectroscopic methods: The fluorescence of the multiple ionised metal ions in steady state concentration; The charge exchange emission during ionisation of evaporated metal ions. In the first step of development of testing system of metal vapours the equipment and instrumentation for charge exchange spectroscopy of Ga and In has been elaborated taking into account the following features of plasma emission. The Ga emission lines occur on the background high temperature plasma black body emission and stray light. Radial distribution of Ga in plasma in the facing plane of Ga flux is desirable

Ion induced optical emission for surface and depth profile analysis

International Nuclear Information System (INIS)

White, C.W.

1977-01-01

Low-energy ion bombardment of solid surfaces results in the emission of infrared, visible, and ultraviolet radiation produced by inelastic ion-solid collision processes. The emitted optical radiation provides important insight into low-energy particle-solid interactions and provides the basis for an analysis technique which can be used for surface and depth profile analysis with high sensitivity. The different kinds of collision induced optical radiation emitted as a result of low-energy particle-solid collisions are reviewed. Line radiation arising from excited states of sputtered atoms or molecules is shown to provide the basis for surface and depth profile analysis. The spectral characteristics of this type of radiation are discussed and applications of the ion induced optical emission technique are presented. These applications include measurements of ion implant profiles, detection sensitivities for submonolayer quantities of impurities on elemental surfaces, and the detection of elemental impurities on complex organic substrates

Simulation and analysis of secondary emission microwave electron gun

International Nuclear Information System (INIS)

He Wencan; Pei Yuanji; Jin Kai; Wu Congfeng

2001-01-01

The development of high-current, short-duration pulses of electrons has been a challenging problem for many year. Micro-pulse-gun (MPG) is a novel concept that employs the resonant amplification of an electron current by secondary electron emission in a RE cavity. Using the computation code URMEL-T, several kinds of RF cavities under the frequency of 2856 MHz were calculated and optimized, the magnetic and electric field distribution in them were got. Through particle-in-cell (PIC) simulation, the self-bunching process in a MPG was proved, the relationship between the cavity length and selected phase and the relationship between the peak electric field and selected phase were got. With cathode material of high secondary emission coefficient, the MPG can produce high current densities (1132-5303 A/cm 2 ) and short pulses (3.15-10 ps)

Secondary Aluminum Production: National Emission Standards for Hazardous Air Pollutants

Science.gov (United States)

National emission standards for hazardous air pollutants (NESHAP) for new and existing sources at secondary aluminum production facilities. Includes rule history, summary, federal register citations and implementation information.

Optical emission spectroscopy of carbon laser plasma ion source

Science.gov (United States)

Balki, Oguzhan; Rahman, Md. Mahmudur; Elsayed-Ali, Hani E.

2018-04-01

Carbon laser plasma generated by an Nd:YAG laser (wavelength 1064 nm, pulse width 7 ns, fluence 4-52 J cm-2) is studied by optical emission spectroscopy and ion time-of-flight. Up to C4+ ions are detected with the ion flux strongly dependent on the laser fluence. The increase in ion charge with the laser fluence is accompanied by observation of multicharged ion lines in the optical spectra. The time-integrated electron temperature Te is calculated from the Boltzmann plot using the C II lines at 392.0, 426.7, and 588.9 nm. Te is found to increase from ∼0.83 eV for a laser fluence of 22 J cm-2 to ∼0.90 eV for 40 J cm-2. The electron density ne is obtained from the Stark broadened profiles of the C II line at 392 nm and is found to increase from ∼ 2 . 1 × 1017cm-3 for 4 J cm-2 to ∼ 3 . 5 × 1017cm-3 for 40 J cm-2. Applying an external electric field parallel to the expanding plume shows no effect on the line emission intensities. Deconvolution of ion time-of-flight signal with a shifted Maxwell-Boltzmann distribution for each charge state results in an ion temperature Ti ∼4.7 and ∼6.0 eV for 20 and 36 J cm-2, respectively.

Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

Energy Technology Data Exchange (ETDEWEB)

Aimoto, K. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)]. E-mail: dm053502@cc.seikei.ac.jp; Aoyagi, S. [Department of Regional Development, Faculty of Life and Environmental Science, Shimane University, 1060 Nishikawatsu-cho, Matsue-shi, Shimane 690-8504 (Japan); Kato, N. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan); Iida, N. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Yamamoto, A. [ULVAC-PHI, Inc., 370 Enzo, Chigasaki, Kanagawa 253-0084 (Japan); Kudo, M. [Department of Applied Physics, Faculty of Engineering, Seikei University, 3-3-1 Kichijioji-Kitamachi, Musashino-shi, Tokyo 180-8633 (Japan)

2006-07-30

We investigated the enhancement of the secondary ion intensity in the TOF-SIMS spectra obtained by Au{sup +} and Au{sub 3} {sup +} bombardment in comparison with Ga{sup +} excitation using polymer samples with different molecular weight distributions. Since the polymer samples used in this experiment have a wide molecular weight distribution, the advantages of the gold cluster primary ion source over monoatomic ion could accurately be evaluated. It was observed that the degree of fragmentation decreased by the usage of cluster primary ion beam compared with monoatomic ion beam, which was observed as a shift of the intensity distribution in the spectra. It was also found out that the mass effect of Au{sup +} and Ga{sup +} as monoatomic primary ion, resulted in about 10-60 times of enhancement for both samples with different molecular distributions. On the other hand, the Au{sub 3} {sup +} bombardment caused intensity enhancement about 100-2600 compared with Ga{sup +} bombardment, depending on the mass range of the detected secondary ion species. The cluster primary ion effect of Au{sub 3} {sup +}, compared with Au{sup +}, therefore, was estimated to be about 10-45.

Ion source techniques for high-speed processing of material surface by ion beams

International Nuclear Information System (INIS)

Ishikawa, Junzo

1990-01-01

The present paper discusses some key or candidate techniques for future ion source development and such ion sources developed by the author. Several types of microwave ion sources for producing low charge state ions have been developed in Japan. When a microwave plasma cathode developed by the author is adapted to a Kaufman type ion source, the electron emission currents are found to be 2.5 A for argon gas and 0.5-0.9 A for oxygen gas. An alternative ionization method for metal atoms is strongly required for high-speed processing of material surface by metal-ion beams. Detailed discussion is made of collisional ionization of vaporized atoms, and negative-ion production (secondary negative-ion emission by sputtering). An impregnated electrode type liquid-metal ion source developed by the author, which has a porous tip structure, is described. The negative-ion production efficiency is quite high. The report also presents a neutral and ionized alkaline-metal bombardment type heavy negative-ion source, which consists of a cesium plasma ion source, suppressor, target electrode, negative-ion extraction electrode, and einzel lens. (N.K.)

Storage of a lithium-ion secondary battery under micro-gravity conditions

Science.gov (United States)

Sone, Yoshitsugu; Ooto, Hiroki; Yamamoto, Masahiro; Eguro, Takashi; Sakai, Shigeru; Yoshida, Teiji; Takahashi, Keiji; Uno, Masatoshi; Hirose, Kazuyuki; Tajima, Michio; Kawaguchi, Jun'ichiro

'HAYABUSA' is a Japanese inter-planetary spacecraft built for the exploration of an asteroid named 'ITOKAWA.' The spacecraft is powered by a 13.2 Ah lithium-ion secondary battery. To realize maximum performance of the battery for long flight operation, the state-of-charge (SOC) of the battery was maintained at ca. 65% during storage, in case it is required for a loss of attitude control. The capacity of the battery was measured during flight operations. Along with the operation in orbit, a ground-test battery was discharged, and both results showed a good agreement. This result confirmed that the performance of the lithium-ion secondary battery stored under micro-gravity conditions is predictable using a ground-test battery.

Secondary-electron yield from Au induced by highly charged Ta ions

Czech Academy of Sciences Publication Activity Database

Krása, Josef; Láska, Leoš; Stöckli, M. P.; Fry, D.

2001-01-01

Roč. 173, - (2001), s. 281-286 ISSN 0168-583X R&D Projects: GA AV ČR IAA1010819 Institutional research plan: CEZ:AV0Z1010914 Keywords : highly charged ion-surface interaction * ion-induced electron emission * angle impact effect Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.041, year: 2001

Bone metabolic activity measured with positron emission tomography and [18F] fluoride ion in renal osteodystrophy: Correlation with bone histomorphometry

International Nuclear Information System (INIS)

Messa, C.; Goodman, W.G.; Hoh, C.K.; Choi, Y.; Nissenson, A.R.; Salusky, I.B.; Phelps, M.E.; Hawkins, R.A.

1993-01-01

The authors evaluated the bone metabolic activity in patients with renal osteodystrophy using positron emission tomography and [ 18 F] fluoride ion. Eight patients had secondary hyperparathyroidism (HPT), and three had low-turnover bone disease. Eleven normal subjects were also studied, and three of the eight HPT patients were reevaluated after therapy. A rate constant (K) describing the net transport of [ 18 F] fluoride ion into a bound compartment in bone was calculated using both a three-compartment model and Patlak graphical analysis. Values of K were compared with biochemical data and with histomorphometric indices. The results indicate that K is significantly higher (P 18 F] fluoride ion can differentiate low turnover from high turnover lesions of renal osteodystropy and provide quantitative estimates of bone cell activity that correlate with histomorphometric data

Pre-equilibrium (exciton) model and the heavy-ion reactions with cluster emission

CERN Document Server

Betak, E

2015-01-01

We bring the possibility to include the cluster emission into the statistical pre-equilibrium (exciton) model enlarged for considering also the heavy ion collisions. At this moment, the calculations have been done without treatment of angular momentum variables, but all the approach can be straightforwardly applied to heavy-ion reactions with cluster emission including the angular momentum variables. The direct motivation of this paper is a possibility of producing the superdeformed nuclei, which are easier to be detected in heavy-ion reactions than in those induced by light projectiles (nucleons, deuterons, $\\alpha$-particles).

X-ray emission in slow highly charged ion-surface collisions

International Nuclear Information System (INIS)

Watanabe, H; Abe, T; Fujita, Y; Sun, J; Takahashi, S; Tona, M; Yoshiyasu, N; Nakamura, N; Sakurai, M; Yamada, C; Ohtani, S

2007-01-01

X-rays emitted in the collisions of highly charged ions with a surface have been measured to investigate dissipation schemes of their potential energies. While 8.1% of the potential energy was dissipated in the collisions of He-like I ions with a W surface, 29.1% has been dissipated in the case of He-like Bi ions. The x-ray emissions play significant roles in the dissipation of the potential energies in the interaction of highly charged heavy ions with the surface

[Atmospheric emission of PCDD/Fs from secondary aluminum metallurgy industry in the southwest area, China].

Science.gov (United States)

Lu, Yi; Zhang, Xiao-Ling; Guo, Zhi-Shun; Jian, Chuan; Zhu, Ming-Ji; Deng, Li; Sun, Jing; Zhang, Qin

2014-01-01

Five secondary aluminum metallurgy enterprises in the southwest area of China were measured for emissions of PCDD/Fs. The results indicated that the emission levels of PCDD/Fs (as TEQ) were 0.015-0.16 ng x m(-3), and the average was 0.093 ng x m(-3) from secondary aluminum metallurgy enterprises. Emission factors of PCDD/Fs (as TEQ) from the five secondary aluminum metallurgy enterprises varied between 0.041 and 4.68 microg x t(-1) aluminum, and the average was 2.01 microg x t(-1) aluminum; among them, PCDD/Fs emission factors from the crucible smelting furnace was the highest. Congener distribution of PCDD/F in stack gas from the five secondary aluminum metallurgies was very different from each other. Moreover, the R(PCDF/PCDD) was the lowest in the enterprise which was installed only with bag filters; the R(PCDF/PCDD) were 3.8-12.6 (the average, 7.7) in the others which were installed with water scrubbers. The results above indicated that the mechanism of PCDD/Fs formation was related to the types of exhaust gas treatment device. The results of this study can provide technical support for the formulation of PCDD/Fs emission standards and the best available techniques in the secondary aluminum metallurgy industry.

A new oxidation flow reactor for measuring secondary aerosol formation of rapidly changing emission sources

Science.gov (United States)

Simonen, Pauli; Saukko, Erkka; Karjalainen, Panu; Timonen, Hilkka; Bloss, Matthew; Aakko-Saksa, Päivi; Rönkkö, Topi; Keskinen, Jorma; Dal Maso, Miikka

2017-04-01

Oxidation flow reactors (OFRs) or environmental chambers can be used to estimate secondary aerosol formation potential of different emission sources. Emissions from anthropogenic sources, such as vehicles, often vary on short timescales. For example, to identify the vehicle driving conditions that lead to high potential secondary aerosol emissions, rapid oxidation of exhaust is needed. However, the residence times in environmental chambers and in most oxidation flow reactors are too long to study these transient effects ( ˜ 100 s in flow reactors and several hours in environmental chambers). Here, we present a new oxidation flow reactor, TSAR (TUT Secondary Aerosol Reactor), which has a short residence time ( ˜ 40 s) and near-laminar flow conditions. These improvements are achieved by reducing the reactor radius and volume. This allows studying, for example, the effect of vehicle driving conditions on the secondary aerosol formation potential of the exhaust. We show that the flow pattern in TSAR is nearly laminar and particle losses are negligible. The secondary organic aerosol (SOA) produced in TSAR has a similar mass spectrum to the SOA produced in the state-of-the-art reactor, PAM (potential aerosol mass). Both reactors produce the same amount of mass, but TSAR has a higher time resolution. We also show that TSAR is capable of measuring the secondary aerosol formation potential of a vehicle during a transient driving cycle and that the fast response of TSAR reveals how different driving conditions affect the amount of formed secondary aerosol. Thus, TSAR can be used to study rapidly changing emission sources, especially the vehicular emissions during transient driving.

Assessment of children environmental exposure to secondary emission of nickel, lead and copper

Directory of Open Access Journals (Sweden)

Jerzy Kwapuliński

2012-12-01

Full Text Available Introduction: Total rating impact of particulate matter in ground air layer recently takes on particular significance in evaluation of health risk. Indeed particulate matter is of interest to many research centres, however in so far PM related works the probability of adverse health impacts were not taken into account triggered with impact of additional presence of particulate matter from secondary dusting. The aim of the work: The work target was determination of secondary emission of Cu, Ni and Pb measured in streets with high traffic volume in many towns of Silesia Voivodeship. Materials and methods: Dust collected from the distance of about 200 m from busy roads in Upper Silesia cities was analyzed by the method of plasma spectrophotometry. The phenomenon of secondary dusting was defined by few coefficients of: secondary emission, enrichment, contamination and parameter of extra mass of a given metal in widespread air pollution. Results: It was concluded that absorbed dose of Cu and Pb changes depends on the area under study and decreases along with child’s age. Decrease of absorbed age depending doses is explained, so far, by significant increase of body mass in comparison to anatomically conditioned size of respiratory system.Also health risk estimated in relation to children residing in selected areas is diversified.. And it also decreases along with the children growing older. It appears, however, that health risk is determined by the volume of secondary PM emission and to children mostly threatened with Ni belong those who are particularly exposed to secondary emission of this metal. The secondary dusting is particularly dangerous for respiratory system and plays more important role than averaged content of this chemical in the environment.

Ion cyclotron and spin-flip emissions from fusion products in tokamaks

International Nuclear Information System (INIS)

Arunasalam, V.; Greene, G.J.; Young, K.M.

1993-02-01

Power emission by fusion products of tokamak plasmas in their ion cyclotron range of frequencies (ICRF) and at their spin-flip resonance frequency is calculated for some specific model fusion product velocity-space distribution functions. The background plasma of say deuterium (D) is assumed to be in equilibrium with a Maxwellian distribution both for the electrons and ions. The fusion product velocity distributions analyzed here are: (1) A monoenergetic velocity space ring distribution. (2) A monoenergetic velocity space spherical shell distribution. (3) An anisotropic Maxwellian distribution with T perpendicular ≠ T parallel and with appreciable drift velocity along the confining magnetic field. Single ''dressed'' test particle spontaneous emission calculations are presented first and the radiation temperature for ion cyclotron emission (ICE) is analyzed both for black-body emission and nonequilibrium conditions. Thresholds for instability and overstability conditions are then examined and quasilinear and nonlinear theories of the electromagnetic ion cyclotron modes are discussed. Distinctions between ''kinetic or causal instabilities'' and ''hydrodynamic instabilities'' are drawn and some numerical estimates are presented for typical tokamak parameters. Semiquantitative remarks are offered on wave accessibility, mode conversion, and parametric decay instabilities as possible for spatially localized ICE. Calculations are carried out both for k parallel = 0 for k parallel ≠ 0. The effects of the temperature anisotropy and large drift velocities in the parallel direction are also examined. Finally, proton spin-flip resonance emission and absorption calculations are also presented both for thermal equilibrium conditions and for an ''inverted'' population of states

Ion cyclotron and spin-flip emissions from fusion products in tokamaks

Energy Technology Data Exchange (ETDEWEB)

Arunasalam, V.; Greene, G.J.; Young, K.M.

1993-02-01

Power emission by fusion products of tokamak plasmas in their ion cyclotron range of frequencies (ICRF) and at their spin-flip resonance frequency is calculated for some specific model fusion product velocity-space distribution functions. The background plasma of say deuterium (D) is assumed to be in equilibrium with a Maxwellian distribution both for the electrons and ions. The fusion product velocity distributions analyzed here are: (1) A monoenergetic velocity space ring distribution. (2) A monoenergetic velocity space spherical shell distribution. (3) An anisotropic Maxwellian distribution with T [perpendicular] [ne] T[parallel]and with appreciable drift velocity along the confining magnetic field. Single dressed'' test particle spontaneous emission calculations are presented first and the radiation temperature for ion cyclotron emission (ICE) is analyzed both for black-body emission and nonequilibrium conditions. Thresholds for instability and overstability conditions are then examined and quasilinear and nonlinear theories of the electromagnetic ion cyclotron modes are discussed. Distinctions between kinetic or causal instabilities'' and hydrodynamic instabilities'' are drawn and some numerical estimates are presented for typical tokamak parameters. Semiquantitative remarks are offered on wave accessibility, mode conversion, and parametric decay instabilities as possible for spatially localized ICE. Calculations are carried out both for k[parallel] = 0 for k[parallel] [ne] 0. The effects of the temperature anisotropy and large drift velocities in the parallel direction are also examined. Finally, proton spin-flip resonance emission and absorption calculations are also presented both for thermal equilibrium conditions and for an inverted'' population of states.

Secondary electron emission anisotropy in oblique incidence of electrons on the (100) Mo

International Nuclear Information System (INIS)

Gomoyunova, M.V.; Zaslavskij, S.L.; Pronin, I.I.

1978-01-01

Studied was the influence of azimuthal plane of incidence of primary particles with energies of 0.5-1.5 keV on the secondary electron emission of the (100) Mo face at the constant polar angle of 45 deg. The measurements were carried out in vacuum of (2-4)x10 -10 torr by modulation technique. It is shown that anisotropy is peculiar to the secondary electron emission of all energies. The anisotropy of emission has two maxima; the high-energy maximum connected with reflected primary electrons and situated near the elastically reflected electrons and weaker pronounced the low-energy one which is found at energies of 100-200 eV and is conditioned by truly secondary electrons. It is shown that the anisotropy, characterizing secondary electrons responsible for the appearance of structure in spectrum, particularly the Auger electrons and the electrons suffering ionizing energy losses, exceeds the anisotropy of continuous spectrum electrons possessing the same energy. The electron diffraction dynamic theory, based on the conception of the united wave field of electrons, has been used to explain the regularities stated

Surface potential measurement of insulators in negative-ion implantation by secondary electron energy-peak shift

International Nuclear Information System (INIS)

Nagumo, Shoji; Toyota, Yoshitaka; Tsuji, Hiroshi; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1993-01-01

Negative-ion implantation is expected to realize charge-up free implantation. In this article, about a way to specify surface potential of negative-ion implanted insulator by secondary-electron-energy distribution, its principle and preliminary experimental results are described. By a measuring system with retarding field type energy analyzer, energy distribution of secondary electron from insulator of Fused Quartz in negative-carbon-ion implantation was measured. As a result the peak-shift of its energy distribution resulted according with the surface potential of insulator. It was found that surface potential of insulator is negatively charged by only several volts. Thus, negative-ion implanted insulator reduced its surface charge-up potential (without any electron supply). Therefore negative-ion implantation is considered to be much more effective method than conventional positive-ion implantation. (author)

Detection of fission fragments by secondary emission; Detection des fragments de fission par emission secondaire

Energy Technology Data Exchange (ETDEWEB)

Audias, A [Commissariat a l' Energie Atomique, Saclay (France). Centre d' Etudes Nucleaires

1965-07-01

This fission fragment detecting apparatus is based on the principle that fragments traversing a thin foil will cause emission of secondary electrons. These electrons are then accelerated (10 kV) and directly detected by means of a plastic scintillator and associated photomultiplier. Some of the advantages of such a detector are, its rapidity, its discriminating power between alpha particles and fission fragments, its small energy loss in detecting the fragments and the relatively great amount of fissionable material which it can contain. This paper is subdivided as follows: a) theoretical considerations b) constructional details of apparatus and some experimental details and c) a study of the secondary emission effect itself. (author) [French] Le detecteur de fragments de fission que nous avons realise est base sur le principe de l'emission secondaire produite par les fragments de fission traversant une feuille mince: les electrons secondaires emis sont acceleres a des tensions telles (de l'ordre de 10 kV), qu'ils soient directement detectables par un scintillateur plastique associe a un photomultiplicateur. L'interet d'un tel detecteur reside: dans sa rapidite, sa tres bonne discrimination alpha, fission, la possibilite de detecter les fragments de fission avec une perte d'energie pouvant rester relativement faible, et la possibilite d'introduire des quantites de matiere fissile plus importantes que dans les autres types de detecteurs. Ce travail comporte: -) un apercu bibliographique de la theorie du phenomene, -) realisation et mise au point du detecteur avec etude experimentale de quelques parametres intervenant dans l'emission secondaire, -) etude de l'emission secondaire (sur la face d'emergence des fragments de fission) en fonction de l'energie du fragment et en fonction de l'epaisseur de matiere traversee avant emission secondaire, et -) une etude comparative de l'emission secondaire sur la face d'incidence et sur la face d'emergence des fragments de

Mechanism of enhancement of controllable secondary-electron emission from fast single electrons

International Nuclear Information System (INIS)

Lorikyan, M.P.; Kavalov, R.L.; Trofimchuk, N.N.; Arvanov, A.N.; Gavalyan, V.G.

For porous KCl films (density approximately 2 percent, thickness 50-400 μm), the controllable secondary electron emission (CSEE) from fast single electrons with energies of 0.7-2 MeV was studied. An electric field E of approximately 10 4 -10 5 V/cm was set up inside the porous films and the emission curves anti sigma = f(E) and the energy spectra of the secondary electrons were measured. The mean emission coefficient anti sigma increases with increasing E, reaching a value of anti sigma approximately equal to 230. Internal enhancement of CSEE under the action of the E field is explained by a process similar to the Townsend semi-self-maintained discharge in gases. The mean free path L/sub e/ of the secondary electrons estimated on the basis of this mechanism of CSEE enhancement is in good agreement with the L/sub e/ value obtained independently from the energy spectra of the secondary electrons. The report examines the effect of the first critical potential U/sub il/ and of the electron affinity of the dielectric α on the formation of CSEE from a porous dielectric film. The possibility of using such films in particle detectors is discussed

Multiplicity of secondary electrons emitted by carbon thin targets by impact of H0, H2+ and H3+ projectiles at MeV energies

International Nuclear Information System (INIS)

Vidovic, Zvonimir

1997-01-01

This work focuses on the study of the emission statistics of secondary electrons from thin carbon foils bombarded with H 0 , H 2 + and H 3 + projectiles in the 0.25 - 2.2 MeV energy range. The phenomenon of secondary electron emission from solids under the impact of swift ions is mainly due to inelastic interactions with target electrons. Phenomenological and theoretical descriptions as well as a summary of the main theoretical models are the subjects of the first chapter. The experimental set-up used to measure event by event the electron emission of the two faces of the thin carbon foils crossed by an energetic projectile is described in the chapter two. In this chapter there are also presented the method and the algorithms used to process experimental spectra in order to obtain the statistical distribution of the emitted electrons. Chapter three presents the measurements of secondary electron emission induced by H 0 atoms passing through thin carbon foils. The secondary electron yields are studied in correlation with emergent projectile charge state. We show the peculiar role of the projectile electron, whether it remains or not bound to the incident proton. The fourth chapter is dedicated to the secondary electron emission induced by H 2 + and H 3 + polyatomic ions. The results are interpreted in terms of collective effects in the interactions of the ions with solids. The role of the proximity of the protons, molecular ions fragments, upon the amplitude of these collected effects is evidenced from the study of the statistics of forward emission. The experiments allowed us to shed light on various aspects of atom and polyatomic ion interactions with solid surfaces. (author)

Matrix effects in ion-induced emission as observed in Ne collisions with Cu-Mg and Cu-Al alloys

Science.gov (United States)

Ferrante, J.; Pepper, S. V.

1983-01-01

Ion induced Auger electron emission is used to study the surfaces of Al, Mg, Cu - 10 at. % Al, Cu - 19.6 at. % Al, and Cu - 7.4 at. % Mg. A neon (Ne) ion beam whose energy is varied from 0.5 to 3 keV is directed at the surface. Excitation of the lighter Ne occurs by the promotion mechanism of Barat and Lichten in asymmetric collisions with Al or Mg atoms. Two principal Auger peaks are observed in the Ne spectrum: one at 22 eV and one at 25 eV. Strong matrix effects are observed in the alloys as a function of energy in which the population of the second peak is greatly enhanced relative to the first over the pure materials. For the pure material over this energy range this ratio is 1.0. For the alloys it can rise to the electronic structure of alloys and to other surface tools such as secondary ion mass spectroscopy.

Polychlorinated dibenzo-p-dioxin and dibenzofuran and polychlorinated biphenyl emissions from different smelting stages in secondary copper metallurgy.

Science.gov (United States)

Hu, Jicheng; Zheng, Minghui; Nie, Zhiqiang; Liu, Wenbin; Liu, Guorui; Zhang, Bing; Xiao, Ke

2013-01-01

Secondary copper production has received much attention for its high emissions of polychlorinated dibenzo-p-dioxin and dibenzofuran (PCDD/F) reported in previous studies. These studies focused on the estimation of total PCDD/F and polychlorinated biphenyl (PCB) emissions from secondary copper smelters. However, large variations in PCDD/F and PCB emissions reported in these studies were not analyzed and discussed further. In this study, stack gas samples at different smelting stages (feeding-fusion, oxidation and deoxidization) were collected from four plants to investigate variations in PCDD/F and PCB emissions and characteristics during the secondary copper smelting process. The results indicate that PCDD/F emissions occur mainly at the feeding-fusion stage and these emissions contribute to 54-88% of the total emissions from the secondary copper smelting process. The variation in feed material and operating conditions at different smelting stages leads to the variation in PCDD/F emissions during the secondary copper smelting process. The total PCDD/F and PCB discharge (stack gas emission+fly ash discharge) is consistent with the copper scrap content in the raw material in the secondary copper smelters investigated. On a production basis of 1 ton copper, the total PCDD/F and dl-PCB discharge was 102, 24.8 and 5.88 μg TEQ t(-1) for the three plants that contained 100%, 30% and 0% copper scrap in their raw material feed, respectively. Copyright © 2012 Elsevier Ltd. All rights reserved.

Ohmic ion temperature and thermal diffusivity profiles from the JET neutron emission profile monitor

Energy Technology Data Exchange (ETDEWEB)

Esposito, B. (ENEA, Frascati (Italy). Centro Ricerche Energia); Marcus, F.B.; Conroy, S.; Jarvis, O.N.; Loughlin, M.J.; Sadler, G.; Belle, P. van (Commission of the European Communities, Abingdon (United Kingdom). JET Joint Undertaking); Adams, J.M.; Watkins, N. (AEA Industrial Technology, Harwell (United Kingdom))

1993-10-01

The JET neutron emission profile monitor was used to study ohmically heated deuterium discharges. The radial profile of the neutron emissivity is deduced from the line-integral data. The profiles of ion temperature, T[sub i], and ion thermal diffusivity, [chi][sub i], are derived under steady-state conditions. The ion thermal diffusivity is higher than, and its scaling with plasma current opposite to, that predicted by neoclassical theory. (author).

Ohmic ion temperature and thermal diffusivity profiles from the JET neutron emission profile monitor

International Nuclear Information System (INIS)

Esposito, B.

1993-01-01

The JET neutron emission profile monitor was used to study ohmically heated deuterium discharges. The radial profile of the neutron emissivity is deduced from the line-integral data. The profiles of ion temperature, T i , and ion thermal diffusivity, χ i , are derived under steady-state conditions. The ion thermal diffusivity is higher than, and its scaling with plasma current opposite to, that predicted by neoclassical theory. (author)

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

Energy Technology Data Exchange (ETDEWEB)

Hirata, K., E-mail: k.hirata@aist.go.jp [National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565 (Japan); Saitoh, Y.; Chiba, A.; Yamada, K.; Narumi, K. [Takasaki Advanced Radiation Research Institute (TARRI), Japan Atomic Energy Agency (JAEA), Takasaki, Gumma 370-1292 (Japan)

2013-11-01

Energetic cluster ions with energies of the order of sub MeV or greater were applied to time-of-flight (TOF) secondary ion (SI) mass spectrometry. This gave various advantages including enhancement of SIs required for chemical structure characterization and prevention of charging effects in SI mass spectra for organic targets. We report some characteristic features of TOF SI mass spectrometry using energetic cluster ion impact ionization and discuss two future applications of it.

Improved Technique for the Determination of Uranium Minor Isotopes Concentrations in Microparticles by Using Secondary Ion Mass-Spectrometer in Multicollection Mode

International Nuclear Information System (INIS)

Aleshin, M.; Elantyev, I.; Stebelkov, Y.

2015-01-01

Traditional method of the analysis implies simultaneous measuring of secondary ion currents of isotopes 234U + , 235U + , 238U + , ions with mass 236 amu (236U + and 235UH + ) and hydride ions 238UH + by using mass-spectrometer Cameca IMS1280 in multicollection mode. Calculating of uranium isotopic composition is performed using the results of 40 successive measurements of those currents (cycles). Duration of each measurement is 8 s. Small amounts of uranium minor isotopes are limitation for precise determination of their concentrations. To prevent the damage of the secondary ions detector the intensity of ion current should be no more than 5 x 10 5 s -1 . This limitation does not allow setting a higher primary ion current for the increasing of minor uranium isotopes ions emission because of the signal of ions 238U + gets too high. New technique is developed to improve the accuracy of determination of uranium minor isotopes concentrations. Process of measurement is divided on two steps. First step is a measurement of ion currents during 20 cycles by five detectors. The second step implies the elimination of ions 238U + hitting to the detector and 10 times increasing of primary ion current. The ratio 235U/238U is calculated from the first step results, so uncertainty of determination of this value is 1.4 times bigger than with duration of 40 cycles of the measurement. The ratios 234U/235U and 236U/235U are calculated during the second step. This technique allows to determine content of 234U and 236U with 3 and 5 times less uncertainties respectively, but with different degree of the sputtering particles. Moreover the duration of each cycle was set less (1 second) to use data more efficient. The technique accordingly with every second counting provides uncertainty of determination 236U concentration 4 times less than traditional method at the same degree of sputtering particles. (author)

Secondary-electron-emission losses in multistage depressed collectors and traveling-wave-tube efficiency improvements with carbon collector electrode surfaces

Science.gov (United States)

Ramins, P.; Ebihara, B. T.

1986-01-01

Secondary-electron-emission losses in multistage depressed collectors (MDC's) and their effects on overall traveling-wave-tube (TWT) efficiency were investigated. Two representative TWT's and several computer-modeled MDC's were used. The experimental techniques provide the measurement of both the TWT overall and the collector efficiencies. The TWT-MDC performance was optimized and measured over a wide range of operating conditions, with geometrically identical collectors, which utilized different electrode surface materials. Comparisons of the performance of copper electrodes to that of various forms of carbon, including pyrolytic and iisotropic graphites, were stressed. The results indicate that: (1) a significant improvement in the TWT overall efficiency was obtained in all cases by the use of carbon, rather than copper electrodes, and (2) that the extent of this efficiency enhancement depended on the characteristics of the TWT, the TWT operating point, the MDC design, and collector voltages. Ion textured graphite was found to be particularly effective in minimizing the secondary-electron-emission losses. Experimental and analytical results, however, indicate that it is at least as important to provide a maximum amount of electrostatic suppression of secondary electrons by proper MDC design. Such suppression, which is obtained by ensuring that a substantial suppressing electric field exists over the regions of the electrodes where most of the current is incident, was found to be very effective. Experimental results indicate that, with proper MDC design and the use of electrode surfaces with low secondary-electron yield, degradation of the collector efficiency can be limited to a few percent.

Visible laser induced positive ion emissions from NaCl nanoparticles prepared by droplet rapid drying

International Nuclear Information System (INIS)

Sun, Mao-Xu; Guo, Deng-Zhu; Xing, Ying-Jie; Zhang, Geng-Min

2012-01-01

Highlights: ► NaCl nanoparticles were firstly prepared by heat induced explosion on silicon wafer. ► We found that laser induced ion emissions from NaCl nanoparticles are more prominent. ► We found that water adsorption can efficiently enhance laser induced ion emissions. ► The ultra-photothermal effect in NaCl nanoparticles was observed and explained. - Abstract: A novel convenient way for the formation of sodium chloride (NaCl) nanoparticles on silicon wafer is proposed by using a droplet rapid drying method. The laser induced positive ion emissions from NaCl nanoparticles with and without water treatment is demonstrated by using a laser desorption/ionization time-of-flight mass spectrometer, with laser intensity well below the plasma formation threshold. It is found that the positive ion emissions from NaCl nanoparticles are obviously higher than that from microsize NaCl particles under soft 532 nm laser irradiations, and water adsorption can efficiently enhance the ion emissions from NaCl nanoparticles. The initial kinetic energies of the emitted ions are estimated as 16–17 eV. The synergy of the ultra-thermal effect in nanomaterials, the defect-mediated multiphoton processes, and the existence of intermediate states in NaCl-water interfaces are suggested as the mechanisms.

Extreme ultra-violet emission spectroscopy of highly charged gadolinium ions with an electron beam ion trap

International Nuclear Information System (INIS)

Ohashi, Hayato; Nakamura, Nobuyuki; Sakaue, Hiroyuki A

2013-01-01

We present extreme ultra-violet emission spectra of highly charged gadolinium ions obtained with an electron beam ion trap at electron energies of 0.53–1.51 keV. The electron energy dependence of the spectra in the 5.7–11.3 nm range is compared with calculation with the flexible atomic code. (paper)

Ion emission from micrometeorite impacts on atmosphereless planets

International Nuclear Information System (INIS)

Wekhof, A.

1980-01-01

Conclusions have been drawn on the generation of intensive high-velocity ions and atoms fluxes on the surfaces of the Moon, Mercury and the atmosphereless satellites of Jupiter by micrometeorite impacts. About 30% of each flux is ejected at small angles and detained by planetary reliefs, forming surface-active layer of alkalines. The combined erosional effect of that layer, the thermocycling and the radiational tracks have been studied. The ion fluxes leaving Jupiter's atmosphereless satellites may well be one of the main sources of the short UV-emission in their vicinities. (Auth.)

Surface potential measurement of the insulator with secondary electron caused by negative ion implantation

International Nuclear Information System (INIS)

Tsuji, Hiroshi; Toyota, Yoshitaka; Nagumo, Syoji; Gotoh, Yasuhito; Ishikawa, Junzo; Sakai, Shigeki; Tanjyo, Masayasu; Matsuda, Kohji.

1994-01-01

Ion implantation has the merit of the good controllability of implantation profile and low temperature process, and has been utilized for the impurity introduction in LSI production. However, positive ion implantation is carried out for insulator or insulated conductor substrates, their charged potential rises, which is a serious problem. As the requirement for them advanced, charge compensation method is not the effective means for resolving it. The negative ion implantation in which charging is little was proposed. When the experiment on the negative ion implantation into insulated conductors was carried out, it was verified that negative ion implantation is effective as the implantation process without charging. The method of determining the charged potential of insulators at the time of negative ion implantation by paying attention to the energy distribution of the secondary electrons emitted from substrates at the time was devised. The energy analyzer for measuring the energy distribution of secondary electrons was made, and the measurement of the charged potential of insulators was carried out. The principle of the measurement, the measuring system and the experimental results are reported. (K.I.)

Variability in the primary emissions and secondary gas and particle formation from vehicles using bioethanol mixtures.

Science.gov (United States)

Gramsch, E; Papapostolou, V; Reyes, F; Vásquez, Y; Castillo, M; Oyola, P; López, G; Cádiz, A; Ferguson, S; Wolfson, M; Lawrence, J; Koutrakis, P

2018-04-01

Bioethanol for use in vehicles is becoming a substantial part of global energy infrastructure because it is renewable and some emissions are reduced. Carbon monoxide (CO) emissions and total hydrocarbons (THC) are reduced, but there is still controversy regarding emissions of nitrogen oxides (NO x ), aldehydes, and ethanol; this may be a concern because all these compounds are precursors of ozone and secondary organic aerosol (SOA). The amount of emissions depends on the ethanol content, but it also may depend on the engine quality and ethanol origin. Thus, a photochemical chamber was used to study secondary gas and aerosol formation from two flex-fueled vehicles using different ethanol blends in gasoline. One vehicle and the fuel used were made in the United States, and the others were made in Brazil. Primary emissions of THC, CO, carbon dioxide (CO 2 ), and nonmethane hydrocarbons (NMHC) from both vehicles decreased as the amount of ethanol in gasoline increased. NO x emissions in the U.S. and Brazilian cars decreased with ethanol content. However, emissions of THC, CO, and NO x from the Brazilian car were markedly higher than those from the U.S. car, showing high variability between vehicle technologies. In the Brazilian car, formation of secondary nitrogen dioxide (NO 2 ) and ozone (O 3 ) was lower for higher ethanol content in the fuel. In the U.S. car, NO 2 and O 3 had a small increase. Secondary particle (particulate matter [PM]) formation in the chamber decreased for both vehicles as the fraction of ethanol in fuel increased, consistent with previous studies. Secondary to primary PM ratios for pure gasoline is 11, also consistent with previous studies. In addition, the time required to form secondary PM is longer for higher ethanol blends. These results indicate that using higher ethanol blends may have a positive impact on air quality. The use of bioethanol can significantly reduce petroleum use and greenhouse gas emissions worldwide. Given the extent of

Transport Theory for Kinetic Emission of Secondary Electrons from Solids

DEFF Research Database (Denmark)

Schou, Jørgen

1980-01-01

a solid is derived. To find the former, existing computations for ion slowing down and experimental and theoretical ones for electron bombardment can be utilized. The energy and angular distribution of the secondary electrons and the secondary electron yield are both expressed as products of the deposited...... in the keV region is largely taken into account. The predicted energy and angular distribution agree with absolute spectra for incident electrons, whereas the agreement with absolute spectra for incident protons is less satisfactory. Extrapolation of the energy distribution down to the vacuum level gives...

Modeling of Jovian Auroral Polar Ion and Proton Precipitation

Science.gov (United States)

Houston, S. J.; Ozak, N. O.; Cravens, T.; Schultz, D. R.; Mauk, B.; Haggerty, D. K.; Young, J. T.

2017-12-01

Auroral particle precipitation dominates the chemical and physical environment of the upper atmospheres and ionospheres of the outer planets. Precipitation of energetic electrons from the middle magnetosphere is responsible for the main auroral oval at Jupiter, but energetic electron, proton, and ion precipitation take place in the polar caps. At least some of the ion precipitation is associated with soft X-ray emission with about 1 GW of power. Theoretical modeling has demonstrated that the incident sulfur and oxygen ion energies must exceed about 0.5 MeV/nucleon (u) in order to produce the measured X-ray emission. In this work we present a model of the transport of magnetospheric oxygen ions as they precipitate into Jupiter's polar atmosphere. We have revised and updated the hybrid Monte Carlo model originally developed by Ozak et al., 2010 to model the Jovian X-ray aurora. We now simulate a wider range of incident oxygen ion energies (10 keV/u - 5 MeV/u) and update the collision cross-sections to model the ionization of the atmospheric neutrals. The polar cap location of the emission and magnetosphere-ionosphere coupling both indicate the associated field-aligned currents must originate near the magnetopause or perhaps the distant tail. Secondary electrons produced in the upper atmosphere by ion precipitation could be accelerated upward to relativistic energies due to the same field-aligned potentials responsible for the downward ion acceleration. To further explore this, we simulate the effect of the secondary electrons generated from the heavy ion precipitation. We use a two-stream transport model that computes the secondary electron fluxes, their escape from the atmosphere, and characterization of the H2 Lyman-Werner band emission, including a predicted observable spectrum with the associated color ratio. Our model predicts that escaping electrons have an energy range from 1 eV to 6 keV, H2 band emission rates produced are on the order of 75 kR for an input

77 FR 16987 - National Emission Standards for Hazardous Air Pollutants: Secondary Aluminum Production

Science.gov (United States)

2012-03-23

... National Emission Standards for Hazardous Air Pollutants: Secondary Aluminum Production AGENCY... for secondary aluminum production (77 FR 8576). The EPA is extending the deadline for written comments... from the Aluminum Association. The Aluminum Association has requested the extension in order to allow...

End point detection in ion milling processes by sputter-induced optical emission spectroscopy

International Nuclear Information System (INIS)

Lu, C.; Dorian, M.; Tabei, M.; Elsea, A.

1984-01-01

The characteristic optical emission from the sputtered material during ion milling processes can provide an unambiguous indication of the presence of the specific etched species. By monitoring the intensity of a representative emission line, the etching process can be precisely terminated at an interface. Enhancement of the etching end point is possible by using a dual-channel photodetection system operating in a ratio or difference mode. The installation of the optical detection system to an existing etching chamber has been greatly facilitated by the use of optical fibers. Using a commercial ion milling system, experimental data for a number of etching processes have been obtained. The result demonstrates that sputter-induced optical emission spectroscopy offers many advantages over other techniques in detecting the etching end point of ion milling processes

Spectroscopic observations of ion line-emission from a magnetically insulated ion diode

International Nuclear Information System (INIS)

Maron, Y.; Peng, H.S.; Rondeau, G.D.; Hammer, D.A.

1984-01-01

Excited ions, produced in the surface-flashover plasma in a magnetically insulated diode, spontaneously emit light from the anode plasma region as well as (if the life time of the excited level is at least a few ns) from the diode acceleration gap. The emission lines of the ions traversing the gap are shifted from their natural wavelength because of the Stark effect due to the diode electric field. If the light is viewed transverse to the acceleration direction, the line width will be mostly determined by Doppler broadening due to ion transverse velocities. The authors use the OMNI II diode (up to 500 kV, 25 kA, 80 ns) with an insulating B field of ≅12 kG and an A-K gap of ≅7mm. The light emission from the entire 6.5 x 12 cm area in front of the anode is viewed parallel to the applied B field. A spectral resolution of 0.5 A is obtained by dispersing the light using a spectrometer followed by 6 optical fibers attached to PM-tubes. Each channel output is calibrated in situ. The spatial resolution across the gap could be made as small as 0.3 mm and the temporal resolution was varied between a few to a few tens of ns. The line spectral profile is obtained at a single discharge for a given distance from the anode surface

Ultrafast secondary emission x-ray imaging detectors

International Nuclear Information System (INIS)

Akkerman, A.; Gibrekhterman, A.; Majewski, S.

1991-07-01

Fast high accuracy, x-ray imaging at high photon flux can be achieved when coupling thin solid convertors to gaseous electron multipliers, operating at low gas pressures. Secondary electron emitted from the convertor foil are multiplied in several successive amplification elements. The obvious advantage of solid x-ray detectors, as compared to gaseous conversion, are the production of parallax-free images and the fast (subnanoseconds) response. These x-ray detectors have many potential applications in basic and applied research. Of particular interest is the possibility of an efficient and ultrafast high resolution imaging of transition radiation,with a reduced dE/dx background. We present experimental results on the operation of the secondary emission x-ray (SEX) detectors, their detection efficiency, localization and time resolution. The experimental work is accompanied by mathematical modelling and computer simulation of transition radiation detectors based on CsI transition radiation convertors. (author)

Pre-compound emission in low-energy heavy-ion interactions

Directory of Open Access Journals (Sweden)

Kumar Sharma Manoj

2017-01-01

Full Text Available Recent experimental studies have shown the presence of pre-compound emission component in heavy ion reactions at low projectile energy ranging from 4 to 7 MeV/nucleons. In earlier measurements strength of the pre-compound component has been estimated from the difference in forward-backward distributions of emitted particles. Present measurement is a part of an ongoing program on the study of reaction dynamics of heavy ion interactions at low energies aimed at investigating the effect of momentum transfer in compound, precompound, complete and incomplete fusion processes in heavy ion reactions. In the present work on the basis of momentum transfer the measurement of the recoil range distributions of heavy residues has been used to decipher the components of compound and pre-compound emission processes in the fusion of 16O projectile with 159Tb and 169Tm targets. The analysis of recoil range distribution measurements show two distinct linear momentum transfer components corresponding to pre-compound and compound nucleus processes are involved. In order to obtain the mean input angular momentum associated with compound and pre-compound emission processes, an online measurement of the spin distributions of the residues has been performed. The analysis of spin distribution indicate that the mean input angular momentum associated with pre-compound products is found to be relatively lower than that associated with compound nucleus process. The pre-compound components obtained from the present analysis are consistent with those obtained from the analysis of excitation functions.

Pre-compound emission in low-energy heavy-ion interactions

Science.gov (United States)

Sharma, Manoj Kumar; Shuaib, Mohd.; Sharma, Vijay R.; Yadav, Abhishek; Singh, Pushpendra P.; Singh, Devendra P.; Unnati; Singh, B. P.; Prasad, R.

2017-11-01

Recent experimental studies have shown the presence of pre-compound emission component in heavy ion reactions at low projectile energy ranging from 4 to 7 MeV/nucleons. In earlier measurements strength of the pre-compound component has been estimated from the difference in forward-backward distributions of emitted particles. Present measurement is a part of an ongoing program on the study of reaction dynamics of heavy ion interactions at low energies aimed at investigating the effect of momentum transfer in compound, precompound, complete and incomplete fusion processes in heavy ion reactions. In the present work on the basis of momentum transfer the measurement of the recoil range distributions of heavy residues has been used to decipher the components of compound and pre-compound emission processes in the fusion of 16O projectile with 159Tb and 169Tm targets. The analysis of recoil range distribution measurements show two distinct linear momentum transfer components corresponding to pre-compound and compound nucleus processes are involved. In order to obtain the mean input angular momentum associated with compound and pre-compound emission processes, an online measurement of the spin distributions of the residues has been performed. The analysis of spin distribution indicate that the mean input angular momentum associated with pre-compound products is found to be relatively lower than that associated with compound nucleus process. The pre-compound components obtained from the present analysis are consistent with those obtained from the analysis of excitation functions.

Field electron emission spectrometer combined with field ion/electron microscope as a field emission laboratory

International Nuclear Information System (INIS)

Shkuratov, S.I.; Ivanov, S.N.; Shilimanov, S.N.

1996-01-01

The facility, combining the field ion microscope, field electron emission microscope and field electron emission spectrometer, is described. Combination of three methodologies makes it possible to carry out the complete cycle of emission studies. Atom-plane and clean surface of the studied samples is prepared by means of field evaporation of the material atom layers without any thermal and radiation impact. This enables the study of atom and electron structure of clean surface of the wide range materials, the study whereof through the field emission methods was previously rather difficult. The temperature of the samples under study changes from 75 up to 2500 K. The energy resolution of the electron analyzer equals 30 MeV. 19 refs., 10 figs

Ion-induced particle desorption in time-of-flight medium energy ion scattering

Science.gov (United States)

Lohmann, S.; Primetzhofer, D.

2018-05-01

Secondary ions emitted from solids upon ion impact are studied in a time-of-flight medium energy ion scattering (ToF-MEIS) set-up. In order to investigate characteristics of the emission processes and to evaluate the potential for surface and thin film analysis, experiments employing TiN and Al samples were conducted. The ejected ions exhibit a low initial kinetic energy of a few eV, thus, requiring a sufficiently high acceleration voltage for detection. Molecular and atomic ions of different charge states originating both from surface contaminations and the sample material are found, and relative yields of several species were determined. Experimental evidence that points towards a predominantly electronic sputtering process is presented. For emitted Ti target atoms an additional nuclear sputtering component is suggested.

Charging of Individual Micron-Size Interstellar/Planetary Dust Grains by Secondary Electron Emissions

Science.gov (United States)

Tankosic, D.; Abbas, M. M.

2012-01-01

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with UV/X-ray radiation, as well as by electron/ion impact. Knowledge of physical and optical properties of individual dust grains is required for understanding of the physical and dynamical processes in space environments and the role of dust in formation of stellar and planetary systems. In this paper, we discuss experimental results on dust charging by electron impact, where low energy electrons are scattered or stick to the dust grains, thereby charging the dust grains negatively, and at sufficiently high energies the incident electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Currently, very limited experimental data are available for charging of individual micron-size dust grains, particularly by low energy electron impact. Available theoretical models based on the Sternglass equation (Sternglass, 1954) are applicable for neutral, planar, and bulk surfaces only. However, charging properties of individual micron-size dust grains are expected to be different from the values measured on bulk materials. Our recent experimental results on individual, positively charged, micron-size lunar dust grains levitated in an electrodynamic balance facility (at NASA-MSFC) indicate that the SEE by electron impact is a complex process. The electron impact may lead to charging or discharging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration (e.g. Abbas et al, 2010). Here we discuss the complex nature of SEE charging properties of individual micron-size lunar dust grains and silica microspheres.

Application of secondary ion mass spectrometry (SIMS) to biological sample analysis

International Nuclear Information System (INIS)

Tamura, Hifumi

1990-01-01

Some major issues and problems related with the analysis of biological samples are discussed, focusing on demonstrated and possible solutions and the application of secondary ion mass spectrometry (SIMS) to investigation of the composition of biological samples. The effective use of secondary electrons in combination with negative ions is most practical for the analysis of biological samples. Regardless of whether positive or negative ions are used, the electric potential at the surface of a sample stays around a constant value because of the absense of the accumulation of electric charges at the surface, leading to almost complete avoidance of the charging of the biological sample. A soft tissue sample can suffer damage to the tissue or migration of atoms in removing water from the sample. Some processes including fixation and freeze drying are available to prevent this. The application of SIMS to biological analysis is still in the basic research stage and further studies will be required to develop practical methods. Possible areas of its application include medicine, pathology, toxicology, pharmacology, plant physiology and other areas related with marine life and marine contamination. (N.K.)

Relations of secondary electron emission to microdosimetry and applications to two-target theory

International Nuclear Information System (INIS)

Forsberg, B.J.; Burlin, T.E.

1978-01-01

Secondary electron emission has been suggested as a phenomenon that offers considerable potential for microdosimetric studies (Burlin, 1973). This potential is examined further through a theoretical study. Previous work on the stochastic nature of secondary electron emission is reviewed and in particular a Monte Carlo programme of McDonald, Lamki and Delaney (1971, 1973) is developed. Lineal energy distributions are presented for tissue equivalent volumes of about 5nm in three materials for different electron energies. The dose mean of lineal energy and the frequency mean of lineal energy are calculated and these results for volumes with linear dimension of a few nanometers are compared with results of Bengtsson and Lindborg (1974), Braby and Ellett (1971) and Dvorak (1975). Several authors have suggested that some radiobiological effects may result from energy deposition in two different targets. An experimental investigation using proportional counter measurements to simulate two-target theory has been reported. In this paper an alternative technique to twin-proportional counter measurements, based on the secondary electron emission from the two sides of a thin foil is discussed. The extended version of the programme calculates the coincident P(nsub(i),nsub(e)) distribution, that is the number of secondary electrons pair (nsub(i), nsub(e)) is recorded, where nsub(i) is the number of secondary electrons leaving the incident side and nsub(e) is leaving the exit side of the foil simultaneously

Microporous carbon derived from polyaniline base as anode material for lithium ion secondary battery

International Nuclear Information System (INIS)

Xiang, Xiaoxia; Liu, Enhui; Huang, Zhengzheng; Shen, Haijie; Tian, Yingying; Xiao, Chengyi; Yang, Jingjing; Mao, Zhaohui

2011-01-01

Highlights: → Nitrogen-containing microporous carbon was prepared from polyaniline base by K 2 CO 3 activation, and used as anode material for lithium ion secondary battery. → K 2 CO 3 activation promotes the formation of amorphous and microporous structure. → High nitrogen content, and large surface area with micropores lead to strong intercalation between carbon and lithium ion, and thus improve the lithium storage capacity. -- Abstract: Microporous carbon with large surface area was prepared from polyaniline base using K 2 CO 3 as an activating agent. The physicochemical properties of the carbon were characterized by scanning electron microscope, X-ray diffraction, Brunauer-Emmett-Teller, elemental analyses and X-ray photoelectron spectroscopy measurement. The electrochemical properties of the microporous carbon as anode material in lithium ion secondary battery were evaluated. The first discharge capacity of the microporous carbon was 1108 mAh g -1 , whose first charge capacity was 624 mAh g -1 , with a coulombic efficiency of 56.3%. After 20 cycling tests, the microporous carbon retains a reversible capacity of 603 mAh g -1 at a current density of 100 mA g -1 . These results clearly demonstrated the potential role of microporous carbon as anode for high capacity lithium ion secondary battery.

Projectile X-ray emission in relativistic ion-atom collisions

Energy Technology Data Exchange (ETDEWEB)

Salem, Shadi Mohammad Ibrahim

2010-03-16

This work reports on the study of the projectile X-ray emission in relativistic ion-atom collisions. Excitation of K-shell in He-like uranium ions, electron capture into H-like uranium ions and Simultaneous ionization and excitation of initially He-like uranium ions have been studied using the experimental storage ring at GSI. For the K{sub {alpha}}{sub 1} and K{sub {alpha}}{sub 2} transitions originating from the excitation of the He-like uranium ions, no alignment was observed. In contrast, the Ly{sub {alpha}}{sub 1} radiation from the simultaneous ionization-excitation process of the He-like uranium ions shows a clear alignment. The experimental value leads to the inclusion of a magnetic term in the interaction potential. The capture process of target electrons into the highly-charged heavy ions was studied using H-like uranium ions at an incident energy of 220 MeV/u, impinging on N{sub 2} gas-target. It was shown that, the strongly aligned electrons captured in 2p{sub 3/2} level couple with the available 1s{sub 1/2} electron which shows no initial directional preference. The magnetic sub-state population of the 2p{sub 3/2} electron is redistributed according to the coupling rules to the magnetic sub-states of the relevant two-electron states. This leads to the large anisotropy in the corresponding individual ground state transitions contributing to the K{sub {alpha}}{sub 1} emission. From the K{sub {alpha}}{sub 1}/K{sub {alpha}}{sub 2} ratio, the current results show that the incoherent addition of the E1 and M2 transition components yield to an almost isotropic emission of the total K{sub {alpha}}{sub 1}. In contrast to the radiative electron capture, the experimental results for the K-shell single excitation of He-like uranium ions indicate that only the {sup 1}P{sub 1} level contributes to the K{sub {alpha}}{sub 1} transition. For this case, the anisotropy parameter {beta}{sub 20} was found to be -0.20{+-}0.03. This work also reports on the study of a two

Fundamental plasma emission involving ion sound waves

International Nuclear Information System (INIS)

Cairns, I.H.

1987-01-01

The theory for fundamental plasma emission by the three-wave processes L ± S → T (where L, S and T denote Langmuir, ion sound and transverse waves, respectively) is developed. Kinematic constraints on the characteristics and growth lengths of waves participating in the wave processes are identified. In addition the rates, path-integrated wave temperatures, and limits on the brightness temperature of the radiation are derived. (author)

Analysis of the emission characteristics of ion sources for high-value optical counting processes

International Nuclear Information System (INIS)

Beermann, Nils

2009-01-01

The production of complex high-quality thin film systems requires a detailed understanding of all partial processes. One of the most relevant partial processes is the condensation of the coating material on the substrate surface. The optical and mechanical material properties can be adjusted by the well-defined impingement of energetic ions during deposition. Thus, in the past, a variety of different ion sources were developed. With respect to the present and future challenges in the production of precisely fabricated high performance optical coatings, the ion emission of the sources has commonly not been characterized sufficiently so far. This question is addressed in the frame of this work which itself is thematically integrated in the field of process-development and -control of ion assisted deposition processes. In a first step, a Faraday cup measurement system was developed which allows the spatially resolved determination of the ion energy distribution as well as the ion current distribution. Subsequently, the ion emission profiles of six ion sources were determined depending on the relevant operating parameters. Consequently, a data pool for process planning and supplementary process analysis is made available. On the basis of the acquired results, the basic correlations between the operating parameters and the ion emission are demonstrated. The specific properties of the individual sources as well as the respective control strategies are pointed out with regard to the thin film properties and production yield. Finally, a synthesis of the results and perspectives for future activities are given. (orig.)

Ultrafast spectral interferometry of resonant secondary emission from quantum wells: From Rayleigh scattering to coherent emission from biexcitons

DEFF Research Database (Denmark)

Birkedal, Dan; Shah, Jagdeep; Pfeiffer, L. N.

1999-01-01

Recent investigations of secondary emission from quantum well excitons following ultrafast resonant excitation have demonstrated an intricate interplay of coherent Rayleigh scattering and incoherent luminescence. We have very recently demonstrated that it is possible to isolate and time resolve...... the coherent field associated with Rayleigh component using ultrafast spectral interferometry or Tadpole, thus, obtaining substantial and new information of the nature of resonant secondary emission. Our observation demonstrates that Rayleigh scattering from static disorder is inherently a non-ergodic process...... invalidating the use of current theories using ensemble averages to describe our observations. Furthermore, we report here a new and hitherto unknown coherent scattering mechanism involving the two-photon coherence associated with the biexciton transition. The process leaves an exciton behind taking up...

Power consumption in positive ion beam converter with electrostatic electron suppressor

International Nuclear Information System (INIS)

Hashimoto, Kiyoshi; Sugawara, Tohru

1985-01-01

The power recovery characteristics of an in-line direct beam converter provided with electrostatic electron suppressor were studied numerically by tracing the orbits of fast primary ions and secondary charged particles generated along their beam path by collision with background gas molecules. It is shown that, in reference to the electrostatic field potential at the point of impact, the energy distribution of secondary ions impinging on the suppressor has two peaks-one corresponding to a zone of high positive potential surrounding the collector and the other to one of slightly negative potential around the electron suppressor. Secondary electron emission from the suppressor is ascribed mainly to the latter peak, associated with impingement of slower secondary ions. Far much power consumed in secondary particle acceleration is spent for emitting electrons from the suppressor than for secondary ions generated by beam-gas collision. The upper limit of background pressure is discussed on the basis of criteria prescribed for restricting the power consumed in this secondary particle acceleration, as for practical convenience of electrode cooling. Numerical examples are given of calculations based on particle trajectory analysis of both primary ions and secondary particles, for the case of a 100 keV-proton sheet beam 10 cm thick of 35 mA/cm 2 current density. (author)

Metal oxide collectors for storing matter technique applied in secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Miśnik, Maciej [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Gdańsk University of Technology (Poland); Konarski, Piotr [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Zawada, Aleksander [Institute of Tele and Radio Technology, ul. Ratuszowa 11, 03-450 Warszawa (Poland); Military University of Technology, Warszawa (Poland)

2016-03-15

We present results of the use of metal and metal oxide substrates that serve as collectors in ‘storing matter’, the quantitative technique of secondary ion mass spectrometry (SIMS). This technique allows separating the two base processes of secondary ion formation in SIMS. Namely, the process of ion sputtering is separated from the process of ionisation. The technique allows sputtering of the analysed sample and storing the sputtered material, with sub-monolayer coverage, onto a collector surface. Such deposits can be then analysed by SIMS, and as a result, the so called ‘matrix effects’ are significantly reduced. We perform deposition of the sputtered material onto Ti and Cu substrates and also onto metal oxide substrates as molybdenum, titanium, tin and indium oxides. The process of sputtering is carried within the same vacuum chamber where the SIMS analysis of the collected material is performed. For sputtering and SIMS analysis of the deposited material we use 5 keV Ar{sup +} beam of 500 nA. The presented results are obtained with the use of stationary collectors. Here we present a case study of chromium. The obtained results show that the molybdenum and titanium oxide substrates used as collectors increase useful yield by two orders, with respect to such pure elemental collectors as Cu and Ti. Here we define useful yield as a ratio of the number of detected secondary ions during SIMS analysis and the number of atoms sputtered during the deposition process.

Accurate and precise measurement of oxygen isotopic fractions and diffusion profiles by selective attenuation of secondary ions (SASI).

Science.gov (United States)

Téllez, Helena; Druce, John; Hong, Jong-Eun; Ishihara, Tatsumi; Kilner, John A

2015-03-03

The accuracy and precision of isotopic analysis in Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) relies on the appropriate reduction of the dead-time and detector saturation effects, especially when analyzing species with high ion yields or present in high concentrations. Conventional approaches to avoid these problems are based on Poisson dead-time correction and/or an overall decrease of the total secondary ion intensity by reducing the target current. This ultimately leads to poor detection limits for the minor isotopes and high uncertainties of the measured isotopic ratios. An alternative strategy consists of the attenuation of those specific secondary ions that saturate the detector, providing an effective extension of the linear dynamic range. In this work, the selective attenuation of secondary ion signals (SASI) approach is applied to the study of oxygen transport properties in electroceramic materials by isotopic labeling with stable (18)O tracer and ToF-SIMS depth profiling. The better analytical performance in terms of accuracy and precision allowed a more reliable determination of the oxygen surface exchange and diffusion coefficients while maintaining good mass resolution and limits of detection for other minor secondary ion species. This improvement is especially relevant to understand the ionic transport mechanisms and properties of solid materials, such as the parallel diffusion pathways (e.g., oxygen diffusion through bulk, grain boundary, or dislocations) in electroceramic materials with relevant applications in energy storage and conversion devices.

Accumulation of selected elements in the pharyngeal tonsils of children as a result of secondary dust emission

Directory of Open Access Journals (Sweden)

Maria Gerycka

2014-09-01

Full Text Available Background. The aim of the study was to determine the influence of secondary dust and car emission on the intoxication of adenoids. Material and methods. The amount of Pb, Be, Ba, Ca, Mg and Sr in pharyngeal tonsils of children living in Tychy (n 86, and in Chorzów (n 76 as well as the amount of the selected elements in suspended dust was determined by the ICP – AES method. The biological material had previously been subjected to mineralization using of nitric acid (V spectrally pure Merck. Results. Secondary emission as a potential additional source of trace elements in tonsils is described by secondary emission coefficient and by the additional weight of the metal present in general air pollution. Conclusions. The degree of accumulation of analyzed elements in the adenoid tissue mostly depends on the content of these elements in soluble form in suspended dust in the ground layer of air, as a result of secondary and car emissions.

Aggregation-induced emission active tetraphenylethene-based sensor for uranyl ion detection.

Science.gov (United States)

Wen, Jun; Huang, Zeng; Hu, Sheng; Li, Shuo; Li, Weiyi; Wang, Xiaolin

2016-11-15

A novel tetraphenylethene-based fluorescent sensor, TPE-T, was developed for the detection of uranyl ions. The selective binding of TPE-T to uranyl ions resulted in a detectable signal owing to the quenching of its aggregation-induced emission. The developed sensor could be used to visually distinguish UO2(2+) from lanthanides, transition metals, and alkali metals under UV light; the presence of other metal ions did not interfere with the detection of uranyl ions. In addition, TPE-T was successfully used for the detection of uranyl ions in river water, illustrating its potential applications in environmental systems. Copyright © 2016 Elsevier B.V. All rights reserved.

Ion emission at the target of the radiographic devices PIVAIR and AIRIX

International Nuclear Information System (INIS)

Compant La Fontaine, A

2007-01-01

On an AIRIX facility, a high-intensity electron beam is used to generate an x-ray pulse for radiographic purposes. The measured electron beam spot size is found to be much larger than its computed value. It is shown that this discrepancy is removed considering ion emission at the target, under electron beam interaction. A model has been developed to simulate the plasma produced during the interaction of the electron beam with the target. The predictions have been compared with ion identification results developed on the PIVAIR prototype accelerator as well as with the x-ray spot size and dose measurements obtained on AIRIX. The simulations show that the ion effect can be reduced by placing a thin foil (100 μm thickness) at an appropriate distance from the target to catch the ions emitted and to stabilize the electron beam spot size. The X-spot size is then reduced, as found experimentally on AIRIX. Moreover, for a smaller thickness barrier foil (5 μm), the ion effect can even be suppressed, producing an X-spot size close to that obtained without ion emission

Secondary electron emission yield on poled silica based thick films

DEFF Research Database (Denmark)

Braga, D.; Poumellec, B.; Cannas, V.

2004-01-01

Studies on the distribution of the electric field produced by a thermal poling process in a layer of Ge-doped silica on silicon substrate, by using secondary electron emission yield (SEEY) measurements () are presented. Comparing 0 between poled and unpoled areas, the SEEY at the origin of electr...

Control of secondary electrons from ion beam impact using a positive potential electrode

Energy Technology Data Exchange (ETDEWEB)

Crowley, T. P., E-mail: tpcrowley@xanthotechnologies.com; Demers, D. R.; Fimognari, P. J. [Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

2016-11-15

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

Secondary electron emission yield in the limit of low electron energy

CERN Document Server

Andronov, A.N.; Kaganovich, I.D.; Startsev, E.A.; Raitses, Y.; Demidov, V.I.

2013-04-22

Secondary electron emission (SEE) from solids plays an important role in many areas of science and technology.1 In recent years, there has been renewed interest in the experimental and theoretical studies of SEE. A recent study proposed that the reflectivity of very low energy electrons from solid surface approaches unity in the limit of zero electron energy2,3,4, If this was indeed the case, this effect would have profound implications on the formation of electron clouds in particle accelerators,2-4 plasma measurements with electrostatic Langmuir probes, and operation of Hall plasma thrusters for spacecraft propulsion5,6. It appears that, the proposed high electron reflectivity at low electron energies contradicts to numerous previous experimental studies of the secondary electron emission7. The goal of this note is to discuss possible causes of these contradictions.

Compositional changes of human hair melanin resulting from bleach treatment investigated by nanoscale secondary ion mass spectrometry.

Science.gov (United States)

Kojima, Toru; Yamada, Hiromi; Isobe, Mitsuru; Yamamoto, Toshihiko; Takeuchi, Miyuki; Aoki, Dan; Matsushita, Yasuyuki; Fukushima, Kazuhiko

2014-11-01

It is important to understand the influence of bleach treatment on human hair because it is one of the most important chemical treatments in hair cosmetic processes. A comparison of the elemental composition of melanin between virgin hair and bleached hair would provide important information about the structural changes of melanin. To investigate the elemental composition of melanin granules in virgin black hair and bleached hair, these hair cross-sections are analyzed by using a nanoscale secondary ion mass spectrometry (NanoSIMS). The virgin black hair and bleached hair samples were embedded in resin and smooth hair cross-sections were obtained using an ultramicrotome. NanoSIMS measurements were performed using a Cs(+) primary ion beam to detect negative secondary ions. More intensive (16) O(-) ions were detected from the melanin granules of bleached hair than from those of virgin black hair in NanoSIMS (16) O(-) ion image. In addition, it was indicated that (16) O(-) ion intensity and (16) O(-) /(12) C(14) N(-) ion intensity ratio of melanin granules in bleached hair were higher than those in virgin black hair. Nanoscale secondary ion mass spectrometry analysis of the cross-sections of virgin black hair and bleached hair indicated that the oxygen content in melanin granules was increased by bleach treatment. © 2014 John Wiley & Sons A/S. Published by John Wiley & Sons Ltd.

The Adsorption of n-Octanohydroxamate Collector on Cu and Fe Oxide Minerals Investigated by Static Secondary Ion Mass Spectrometry

Directory of Open Access Journals (Sweden)

Alan N. Buckley

2012-12-01

Full Text Available The feasibility of investigating the adsorption of n-octanohydroxamate collector on copper and iron oxide minerals with static secondary ion mass spectrometry has been assessed. Secondary ion mass spectra were determined for abraded surfaces of air-exposed copper metal, malachite, pseudomalachite and magnetite that had been conditioned in aqueous potassium hydrogen n-octanohydroxamate solution, as well as for the corresponding bulk CuII and FeIII complexes. In each case, the chemical species present at the solid/vacuum interface of a similarly prepared surface were established by X-ray photoelectron spectroscopy. The most abundant positive and negative metal-containing fragment ions identified for the bulk complexes were also found to be diagnostic secondary ions for the collector adsorbed on the oxide surfaces. The relative abundances of those diagnostic ions varied with, and could be rationalised by, the monolayer or multilayer coverage of the adsorbed collector. However, the precise mass values for the diagnostic ions were not able to corroborate the different bonding in the copper and iron hydroxamate systems that had been deduced from photoelectron and vibrational spectra. Parent secondary ions were able to provide supporting information on the co-adsorption of hydroxamic acid at each conditioned surface.

Applications of secondary ion mass spectrometry in catalysis and surface chemistry

NARCIS (Netherlands)

Borg, H.J.; Niemantsverdriet, J.W.; Spivey, J.J.; Agarwal, S.K.

1994-01-01

A review with 182 refs. is given on phys. phenomena such as sputtering, ion emission, ionization and neutralization which are involved in SIMS. Applications of SIMS in catalysis and obtaining information about catalysts interactions with gases promoters and poisons are described. Also applications

Ultrafast interfeometric investigation of resonant secondary emission from quantum well excitons

DEFF Research Database (Denmark)

Birkedal, Dan; Shah, Jagdeep; Pfeiffer, L. N.

1999-01-01

Coherent Rayleigh scattering and incoherent luminescence comprise the secondary emission from quantum well exciton following ultrafast resonant excitation. We show that coherent Rayleigh scattering forms a time-dependent speckle pattern and isolate in a single speckle the Rayleigh component from...

Mechanism of negative ion emission from surfaces of ferroelectrics

Czech Academy of Sciences Publication Activity Database

Šroubek, Zdeněk

2012-01-01

Roč. 606, 15-16 (2012), s. 1327-1330 ISSN 0039-6028 Institutional support: RVO:67985882 Keywords : Surface of ferroelectrics * Ion emission Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.838, year: 2012 http://www.sciencedirect.com/science/article/pii/S0039602812001525#gts0005

[Applications of atomic emission spectrum from liquid electrode discharge to metal ion detection].

Science.gov (United States)

Mao, Xiu-Ling; Wu, Jian; Ying, Yi-Bin

2010-02-01

The fast and precise detection of metal ion is an important research project concerning studies in diverse academic fields and different kinds of detecting technologies. In the present paper, the authors review the research on atomic emission spectrum based on liquid electrode discharge and its applications in the detection of metal ion. In the first part of this paper the principles and characteristics of the methods based on electrochemistry and spectroscopy were introduced. The methods of ion-selective electrode (ISE), anodic stripping voltammetry, atomic emission spectrum and atomic absorption spectrum were included in this part and discussed comparatively. Then the principles and characteristics of liquid electrode spectra for metal ion detection were introduced. The mechanism of the plasma production and the characteristics of the plasma spectrum as well as its advantages compared with other methods were discussed. Secondly, the authors divided the discharge system into two types and named them single liquid-electrode discharge and double-liquid electrode respectively, according to the number of the liquid electrode and the configuration of the discharge system, and the development as well as the present research status of each type was illustrated. Then the characteristics and configurations of the discharge systems including ECGD, SCGD, LS-APGD and capillary discharge were discussed in detail as examples of the two types. By taking advantage of the technology of atomic emission spectrum based on liquid electrode discharge, the detecting limit of heavy metals such as copper, mercury and argent as well as active metal ions including sodium, potass and magnesium can achieve microg x L(-1). Finally, the advantages and problems of the liquid-electrode discharge applied in detection of metal ion were discussed. And the applications of the atomic emission spectrum based on liquid electrode discharge were prospected.

Magnetic insulation of secondary electrons in plasma source ion implantation

International Nuclear Information System (INIS)

Rej, D.J.; Wood, B.P.; Faehl, R.J.; Fleischmann, H.H.

1993-01-01

The uncontrolled loss of accelerated secondary electrons in plasma source ion implantation (PSII) can significantly reduce system efficiency and poses a potential x-ray hazard. This loss might be reduced by a magnetic field applied near the workpiece. The concept of magnetically-insulated PSII is proposed, in which secondary electrons are trapped to form a virtual cathode layer near the workpiece surface where the local electric field is essentially eliminated. Subsequent electrons that are emitted can then be reabsorbed by the workpiece. Estimates of anomalous electron transport from microinstabilities are made. Insight into the process is gained with multi-dimensional particle-in-cell simulations

Secondary electron images obtained with a standard photoelectron emission microscope set-up

International Nuclear Information System (INIS)

Benka, Oswald; Zeppenfeld, Peter

2005-01-01

The first results of secondary electron images excited by 3-4.3 keV electrons are presented. The images are obtained with a standard FOCUS-PEEM set-up equipped with an imaging energy filter (IEF). The electron gun was mounted on a standard PEEM entrance flange at an angle of 25 deg. with respect to the sample surface. A low extraction voltage of 500 V was used to minimize the deflection of the electron beam by the PEEM extraction electrode. The secondary electron images are compared to photoelectron images excited by a standard 4.9 eV UV lamp. In the case of a Cu pattern on a Si substrate it is found that the lateral resolution without the IEF is about the same for electron and photon excitation but that the relative electron emission intensities are very different. The use of the IEF reduces the lateral resolution. Images for secondary electron energies between eV 1 and eV 2 were obtained by setting the IEF to -V 1 and -V 2 ∼-(V 1 +5V) potentials and taking the difference of both images. Images up to 100 eV electron energies were recorded. The material contrast obtained in these difference images is discussed in terms of a secondary electron and photoelectron emission model and secondary electron energy spectra measured with a LEED-Auger spectrometer

Influence of ion beam and geometrical parameters on properties of Si thin films grown by Ar ion beam sputtering

Energy Technology Data Exchange (ETDEWEB)

Bundesmann, Carsten; Feder, Rene; Neumann, Horst [Leibniz-Institut fuer Oberflaechenmodifizierung e.V., Leipzig (Germany)

2012-07-01

Ion beam sputtering (IBS) offers, in contrast to other physical vapour deposition techniques, such as magnetron sputtering or electron beam evaporation, the opportunity to change the properties of the layer forming particles (sputtered and scattered particles) by varying ion beam parameters (ion species, ion energy) and geometrical parameters (ion incidence angle, emission angle). Consequently, these effects can be utilized to tailor thin film properties [1]. The goal is to study systematically the correlations between the primary and secondary parameters and, at last, the effects on the properties of Si thin films, such as optical properties, stress, surface topography and composition. First experimental results are presented for Ar-ion sputtering of Si.

Primary emissions and secondary organic aerosol formation from the exhaust of a flex-fuel (ethanol) vehicle

Science.gov (United States)

Suarez-Bertoa, R.; Zardini, A. A.; Platt, S. M.; Hellebust, S.; Pieber, S. M.; El Haddad, I.; Temime-Roussel, B.; Baltensperger, U.; Marchand, N.; Prévôt, A. S. H.; Astorga, C.

2015-09-01

Incentives to use biofuels may result in increasing vehicular emissions of compounds detrimental to air quality. Therefore, regulated and unregulated emissions from a Euro 5a flex-fuel vehicle, tested using E85 and E75 blends (gasoline containing 85% and 75% of ethanol (vol/vol), respectively), were investigated at 22 and -7 °C over the New European Driving Cycle, at the Vehicle Emission Laboratory at the European Commission Joint Research Centre Ispra, Italy. Vehicle exhaust was comprehensively analyzed at the tailpipe and in a dilution tunnel. A fraction of the exhaust was injected into a mobile smog chamber to study the photochemical aging of the mixture. We found that emissions from a flex-fuel vehicle, fueled by E85 and E75, led to secondary organic aerosol (SOA) formation, despite the low aromatic content of these fuel blends. Emissions of regulated and unregulated compounds, as well as emissions of black carbon (BC) and primary organic aerosol (POA) and SOA formation were higher at -7 °C. The flex-fuel unregulated emissions, mainly composed of ethanol and acetaldehyde, resulted in very high ozone formation potential and SOA, especially at low temperature (860 mg O3 km-1 and up to 38 mg C kg-1). After an OH exposure of 10 × 106 cm-3 h, SOA mass was, on average, 3 times larger than total primary particle mass emissions (BC + POA) with a high O:C ratio (up to 0.7 and 0.5 at 22 and -7 °C, respectively) typical of highly oxidized mixtures. Furthermore, high resolution organic mass spectra showed high 44/43 ratios (ratio of the ions m/z 44 and m/z 43) characteristic of low-volatility oxygenated organic aerosol. We also hypothesize that SOA formation from vehicular emissions could be due to oxidation products of ethanol and acetaldehyde, both short-chain oxygenated VOCs, e.g. methylglyoxal and acetic acid, and not only from aromatic compounds.

X-ray emission in heavy-ion collisions. Progress report, April 1, 1979-March 31, 1980

International Nuclear Information System (INIS)

Watson, R.L.

1980-04-01

Recent research in the cyclotron institute and department of chemistry at Texas A and M University on the x-ray emission in heavy-ion collisions is described. Areas covered include: spectra of Ka x-rays from 64 MeV sulfur ions traveling in solids; foil-excited Ka x-ray transitions in few-electron sulfur ions; high-resolution study of the target thickness dependence of x-ray emission from 65 MeV sulfur ions; dynamic screening of highly stripped sulfur ions in solids; Mg Ka x-ray satellites excited by ion bombardment, multiplet structure and dependence on projectile and chemical environment; angular distributions of beam and target Ka x-rays; chemical effects on K x-ray satellites of fluorine compounds; and a non-linear least-squares peak-fitting program employing Voight functions

Secondary electron emission and its role in the space environment

Science.gov (United States)

Němeček, Z.; Pavlů, J.; Richterová, I.; Šafránková, J.; Vaverka, J.

2018-01-01

The role of dust in the space environment is of increasing interest in recent years and also the fast development of fusion devices with a magnetic confinement brought new issues in the plasma-surface interaction. Among other processes, secondary electron emission plays an important role for dust charging in interplanetary space and its importance increases at and above the surfaces of airless bodies like planets, moons, comets or asteroids. A similar situation can be found in many industrial applications where the dust is a final product or an unintentional impurity. The present paper reviews the progress in laboratory investigations of the secondary emission process as well as an evolution of the modeling of the interaction of energetic electrons with dust grains of different materials and sizes. The results of the model are discussed in view of latest laboratory simulations and they are finally applied on the estimation of an interaction of the solar wind and magnetospheric plasmas with the dust attached to or levitating above the lunar surface.

Electron and X-ray emission in collisions of multiply charged ions and atoms

International Nuclear Information System (INIS)

Woerlee, P.H.

1979-01-01

The author presents experimental results of electron and X-ray emission following slow collisions of multiply charged ions and atoms. The aim of the investigation was to study the mechanisms which are responsible for the emission. (G.T.H.)

0.5 to 6 MeV Ar ion induced X-ray emission in view to analytical application

International Nuclear Information System (INIS)

Tenorio Castilleros, M.D.

1979-01-01

A study of the X-ray emission induced by 0.5 to 6 MeV Ar ions has been realized in view of multielemental analytical applications. The historical development of the use of heavy ion induced X-ray emission in analysis and the theoretical background of inner-shell ionization in heavy ion-atom collisions are described. The emission of non characteristic X-rays and the effects related to the penetration of heavy ions in matter are also related. The experimental part contains a description of the experimental devices and of the X-ray spectra fitting method. Thick target yields as a function of the target Z and the Ar ion energy are reported. The analytical possibilities are examined and an application to the analysis of Si and Cl in cadmium telluride crystals is given [fr

Intrinsic Lead Ion Emissions in Zero-Dimensional Cs4PbBr6 Nanocrystals

KAUST Repository

Yin, Jun; Zhang, Yuhai; Bruno, Annalisa; Soci, Cesare; Bakr, Osman; Bredas, Jean-Luc; Mohammed, Omar F.

2017-01-01

-energy UV emission at approximately 350 nm to the allowed optical transition of 3P1 to 1S0 in Pb2+ ions and the low-energy UV emission at approximately 400 nm to the charge-transfer state involved in the 0D NC host lattice (D-state). In the emissive Cs4PbBr6

Single impacts of keV fullerene ions on free standing graphene: Emission of ions and electrons from confined volume

Energy Technology Data Exchange (ETDEWEB)

Verkhoturov, Stanislav V.; Geng, Sheng; Schweikert, Emile A., E-mail: schweikert@chem.tamu.edu [Department of Chemistry, Texas A& M University, College Station, Texas 77843-3144 (United States); Czerwinski, Bartlomiej [Institute of Condensed Matter and Nanosciences–Bio and Soft Matter (IMCN/BSMA), Université Catholique de Louvain, 1 Croix du Sud, B-1348 Louvain-la-Neuve (Belgium); Applied Physics, Division of Materials Science, Department of Engineering Sciences and Mathematics, Luleå University of Technology, SE-971 87 Luleå (Sweden); Young, Amanda E. [Materials Characterization Facility, Texas A& M University, College Station, Texas 77843-3122 (United States); Delcorte, Arnaud [Institute of Condensed Matter and Nanosciences–Bio and Soft Matter (IMCN/BSMA), Université Catholique de Louvain, 1 Croix du Sud, B-1348 Louvain-la-Neuve (Belgium)

2015-10-28

We present the first data from individual C{sub 60} impacting one to four layer graphene at 25 and 50 keV. Negative secondary ions and electrons emitted in transmission were recorded separately from each impact. The yields for C{sub n}{sup −} clusters are above 10% for n ≤ 4, they oscillate with electron affinities and decrease exponentially with n. The result can be explained with the aid of MD simulation as a post-collision process where sufficient vibrational energy is accumulated around the rim of the impact hole for sputtering of carbon clusters. The ionization probability can be estimated by comparing experimental yields of C{sub n}{sup −} with those of C{sub n}{sup 0} from MD simulation, where it increases exponentially with n. The ionization probability can be approximated with ejecta from a thermally excited (3700 K) rim damped by cluster fragmentation and electron detachment. The experimental electron probability distributions are Poisson-like. On average, three electrons of thermal energies are emitted per impact. The thermal excitation model invoked for C{sub n}{sup −} emission can also explain the emission of electrons. The interaction of C{sub 60} with graphene is fundamentally different from impacts on 3D targets. A key characteristic is the high degree of ionization of the ejecta.

'Beam-emission spectroscopy' diagnostics also measure edge fast-ion light

International Nuclear Information System (INIS)

Heidbrink, W W; Bortolon, A; McKee, G R; Smith, D R

2011-01-01

Beam-emission spectroscopy (BES) diagnostics normally detect fluctuations in the light emitted by an injected neutral beam. Under some circumstances, however, light from fast ions that charge exchange in the high neutral-density region at the edge of the plasma make appreciable contributions to the BES signals. This 'passive' fast-ion D α (FIDA) light appears in BES signals from both the DIII-D tokamak and the National Spherical Torus Experiment (NSTX). One type of passive FIDA light is associated with classical orbits that traverse the edge. Another type is caused by instabilities that expel fast ions from the core; this light can complicate measurement of the instability eigenfunction.

Secondary electron emission and self-consistent charge transport in semi-insulating samples

Energy Technology Data Exchange (ETDEWEB)

Fitting, H.-J. [Institute of Physics, University of Rostock, Universitaetsplatz 3, D-18051 Rostock (Germany); Touzin, M. [Unite Materiaux et Transformations, UMR CNRS 8207, Universite de Lille 1, F-59655 Villeneuve d' Ascq (France)

2011-08-15

Electron beam induced self-consistent charge transport and secondary electron emission (SEE) in insulators are described by means of an electron-hole flight-drift model (FDM) now extended by a certain intrinsic conductivity (c) and are implemented by an iterative computer simulation. Ballistic secondary electrons (SE) and holes, their attenuation to drifting charge carriers, and their recombination, trapping, and field- and temperature-dependent detrapping are included. As a main result the time dependent ''true'' secondary electron emission rate {delta}(t) released from the target material and based on ballistic electrons and the spatial distributions of currents j(x,t), charges {rho}(x,t), field F(x,t), and potential V(x,t) are obtained where V{sub 0} = V(0,t) presents the surface potential. The intrinsic electronic conductivity limits the charging process and leads to a conduction sample current to the support. In that case the steady-state total SE yield will be fixed below the unit: i.e., {sigma} {eta} + {delta} < 1.

New experiments in organic, fast-atom-bomdardment, and secondary-ion mass spectrometry

International Nuclear Information System (INIS)

DiDonato, G.C.

1987-01-01

The goal of research presented in this dissertation is the creative use of new ionization and instrumental techniques in mass spectrometry. This goal manifests itself in three areas of mass spectrometry. In the first portion, modern, state-of-the-art instrumentation and new experiments were used to re-examine the mass spectra of transition-metal acetates and acetylacetonates. High resolution, chemical ionization, negative chemical ionization, and extended-mass-range mass spectrometry uncovered a wealth of new gas-phase ionic species. Energy-resolved mass spectrometry/mass spectrometry was applied to the characterization of molecular and fragment ion first-row transition-metal acetylacetonates, and comprises the second portion of the thesis. Studies in fast-atom-bombardment mass spectrometry are the subject of the third portion of the dissertation. Since fast-atom bombardment samples a liquid matrix, absolute and relative abundances of sputtered secondary ions are influenced by solution chemistry. The design and construction of an imaging secondary-ion mass spectrometer is the subject of the final portion of the thesis. This instrument provides for direct mass-spectrometric analysis of thin-layer and paper chromatograms and electrophoretograms

Proceedings of the RCNP cascade project workshop 'heavy ion secondary beam course'

International Nuclear Information System (INIS)

1991-10-01

In the Research Center for Nuclear Physics (RCNP), Osaka University, as one of the experimental facilities utilizing the heavy ion beam from the ring cyclotron, the construction of the heavy ion secondary beam course has been in progress. This course can supply the unstable nuclei produced by a heavy ion reaction as a secondary beam, and is expected to become the powerful experimental facility for elucidating the condition of atomic nuclei in the extreme condition and their reaction mode. At present, the arrangement is advanced aiming at the utilization from the end of fiscal year 1991. Toward the start of joint utilization experiment, in order to examine the expected physics, concrete experimental plan and the preparation plan accompanying them, the workshop including the introduction of the course was held. On December 15, 1990, the workshop with the theme on the nuclear reaction by unstable nucleus beam was held, and on January 26, 1991, that with the theme on the spectroscopy of unstable nuclei was held. In each meeting, there were more than 20 participants. In this report, the gists of 18 papers are collected. (K.I.)

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

OpenAIRE

Moritomo, Yutaka; Goto, Kensuke; Shibata, Takayuki

2015-01-01

Manganese hexacyanoferrate (Mn-PBA) is a promising cathode material forsodium-ion secondary battery (SIB) with high average voltage (=3.4 V) against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grown)to 15 C (glucose-treated). Our observation suggests that thermal tr...

X-ray emission in collisions of highly charged I, Pr, Ho, and Bi ions with a W surface

International Nuclear Information System (INIS)

Watanabe, H.; Tona, M.; Ohtani, S.; Sun, J.; Nakamura, N.; Yamada, C.; Yoshiyasu, N.; Sakurai, M.

2007-01-01

X-ray emission yields, which are defined as the total number of emitted x-ray photons per incident ion, and dissipated fractions of potential energies through x-ray emission have been measured for slow highly charged ions of I, Pr, Ho, and Bi colliding with a W surface. A larger amount of potential energy was consumed for the x-ray emission with increasing the atomic number and the charge state. The present measurements show that x-ray emission is one of the main decay channels of hollow atoms produced in collisions of very highly charged ions of heavy elements

Complex Role of Secondary Electron Emissions in Dust Grain Charging in Space Environments: Measurements on Apollo 11 and 17 Dust Grains

Science.gov (United States)

Abbas, M. M.; Tankosic, D.; Spann, J. F.; LeClair, A. C.

2010-01-01

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with radiation from nearby sources, or by electron/ion collisions by sticking or secondary electron emissions. Knowledge of the dust grain charges and equilibrium potentials is important for understanding of a variety of physical and dynamical processes in the interstellar medium (ISM), and heliospheric, interplanetary, planetary, and lunar environments. The high vacuum environment on the lunar surface leads to some unusual physical and dynamical phenomena involving dust grains with high adhesive characteristics, and levitation and transportation over long distances. It has been well recognized that the charging properties of individual micron/submicron size dust grains are expected to be substantially different from the corresponding values for bulk materials and theoretical models. In this paper we present experimental results on charging of individual dust grains selected from Apollo 11 and Apollo 17 dust samples by exposing them to mono-energetic electron beams in the 10- 400 eV energy range. The charging rates of positively and negatively charged particles of approximately 0.2 to 13 microns diameters are discussed in terms of the secondary electron emission (SEE) process, which is found to be a complex charging process at electron energies as low as 10-25 eV, with strong particle size dependence. The measurements indicate substantial differences between dust charging properties of individual small size dust grains and of bulk materials.

Electron emission in collisions of intermediate energy ions with atoms

International Nuclear Information System (INIS)

Garibotti, C.R.

1988-01-01

The aim of this work, is the analysis of the processes of electronic emission produced in the collisions of small ions (H + , He ++ ) of intermediate energy (50 a 200 KeV/amu) with light gaseous targets. (A.C.A.G.) [pt

Parametric analysis of the soft electron emission in ion-helium collisions

Energy Technology Data Exchange (ETDEWEB)

Cravero, W.R. (Centro Atomico Bariloche and CONICET, S.C. de Bariloche (Argentina)); Garibotti, C.R. (Centro Atomico Bariloche and CONICET, S.C. de Bariloche (Argentina)); Gasaneo, G. (Centro Atomico Bariloche and CONICET, S.C. de Bariloche (Argentina))

1994-03-01

We studied the doubly differential cross section (DDCS) for ion-helium ionization, in the region of near zero emission velocity. We expanded the DDCS in powers of the electron emission velocity, with angle-dependent weight coefficients, which are determined from available experimental data and calculated using the CDW-EIS theory. We also compared this expansion with a previously used Legendre polynomials expansion of the DDCS. (orig.)

Emission of high-energy, light particles from intermediate-energy heavy-ion reactions

International Nuclear Information System (INIS)

Ball, J.B.; Auble, R.L.

1982-01-01

One of the early surprises in examining reaction products from heavy ion reactions at 10 MeV/nucleon and above was the large yield of light particles emitted and the high energies to which the spectra of these particles extended. The interpretation of the origin of the high energy light ions has evolved from a picture of projectile excitation and subsequent evaporation to one of pre-equilibrium (or nonequilibrium) emission. The time scale for particle emission has thus moved from one that occurs following the initial collision to one that occurs at the very early stages of the collision. Research at ORNL on this phenomenon is reviewed

Study on the Emission Property of YBO{sub 3} with Co-doping of Ce and Gd Ions

Energy Technology Data Exchange (ETDEWEB)

Jang, Soyeong; Lim, Junhwi; Lee, Y. S. [Soongsil University, Seoul (Korea, Republic of)

2017-08-15

We investigated the co-doping effect of Ce{sup 3+} and Gd{sup 3+} ions on the visible emission in vaterite-type orthoborate YBO{sub 3}. By using photoluminescence and photoluminescence excitation spectroscopy, we found that the co-doping of the Gd{sup 3+} ions increased the violet-blue emission of the Ce ions significantly. In basis of the optical spectroscopic data, we discussed our results in terms of the energy transfer between Ce{sup 3+} and Gd{sup 3+} ions.

Effect of co-doping Tm3+ ions on the emission properties of Dy3+ ions in tellurite glasses

International Nuclear Information System (INIS)

Sasikala, T.; Rama Moorthy, L.; Mohan Babu, A.; Srinivasa Rao, T.

2013-01-01

The present work reports the absorption, photoluminescence and decay properties of singly doped Dy 3+ and co-doped Dy 3+ /Tm 3+ ions in TeO 2 +ZnO+K 2 O+CaO (TZKC) glasses prepared by the melt quenching technique. The glassy nature of the host glass has been confirmed by X-ray diffraction analysis and the primary vibrational modes were determined from the Raman spectrum. Judd–Ofelt (JO) analysis has been used to calculate the radiative transition rates, branching ratios and radiative lifetime of the emitting 4 F 9/2 state. The effect of co-doping of different concentrations of Tm 3+ ions on the emission properties of Dy 3+ ions has been investigated. The decay profiles of the 4 F 9/2 level were fitted to double exponential as well as Inokuti–Hirayama (IH) model to determine the energy transfer rates between Dy 3+ and Tm 3+ ions. The energy transfer rates found to increase with the increase of Tm 3+ ions concentration. The chromaticity coordinates and color purity of the emitted light for all glasses were determined. - Graphical abstract: The graphical abstract shows the emission spectra of Dy 3+ , Tm 3+ and Dy 3+ /Tm 3+ co-doped TZKC glasses recorded by exciting at 355 nm wavelength. - Highlights: • Zinc tellurite glasses doped with Dy 3+ , Tm 3+ and Dy 3+ /Tm 3+ ions were prepared. • XRD, DTA and Raman spectral measurements were recorded to know the nature of host. • Energy transfer occurs from Dy 3+ ions to Tm 3+ ions. • The color purity of the emitted light was determined

EMISSION SPECTRUM OF HELIUM-LIKE IONS IN PHOTOIONIZED PLASMAS

International Nuclear Information System (INIS)

Wang, Feilu; Salzmann, David; Zhao, Gang; Takabe, Hideaki

2012-01-01

The aim of the present paper is to investigate the influence of inner-shell photoionization and photoexcitation on He α and its satellite's spectra in photoionized plasmas. An analysis is carried out on the relative importance of the various atomic processes in photoionized plasmas as a function of the electron temperature and irradiation conditions. In particular, we investigate the influence of K-shell photoionization of Li-like ions on the He α spectrum and of Be-like ions on the He α satellites. It is found that in photoionized plasmas these inner-shell processes contribute significantly under low radiation temperature and/or intensity, when Li- and Be-like ions are highly abundant but highly ionized H-like ions are rare. A short discussion is presented about the parameter space in which the excited 1s2p state has statistical or non-statistical distributions, and how such distributions affect the emission spectrum.

Study of a high power hydrogen beam diagnostic based on secondary electron emission

Energy Technology Data Exchange (ETDEWEB)

Sartori, E., E-mail: emanuele.sartori@igi.cnr.it [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy); Department of Management and Engineering, University di Padova strad. S. Nicola 3, 36100 Vicenza (Italy); Panasenkov, A. [NRC, Kurchatov Institute, 1, Kurchatov Sq, Moscow 123182 (Russian Federation); Veltri, P. [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy); INFN-LNL, viale dell’Università n. 2, 35020 Legnaro (Italy); Serianni, G.; Pasqualotto, R. [Consorzio RFX (CNR, ENEA, INFN, UNIPD, Acciaierie Venete SpA), Corso Stati Uniti 4, 35127 Padova (Italy)

2016-11-15

In high power neutral beams for fusion, beam uniformity is an important figure of merit. Knowing the transverse power profile is essential during the initial phases of beam source operation, such as those expected for the ITER heating neutral beam (HNB) test facility. To measure it a diagnostic technique is proposed, based on the collection of secondary electrons generated by beam-surface and beam-gas interactions, by an array of positively biased collectors placed behind the calorimeter tubes. This measurement showed in the IREK test stand good proportionality to the primary beam current. To investigate the diagnostic performances in different conditions, we developed a numerical model of secondary electron emission, induced by beam particle impact on the copper tubes, and reproducing the cascade of secondary emission caused by successive electron impacts. The model is first validated against IREK measurements. It is then applied to the HNB case, to assess the locality of the measurement, the proportionality to the beam current density, and the influence of beam plasma.

On the interpretation of the intense emission of tungsten ions at about 5

International Nuclear Information System (INIS)

Jonauskas, V; Kucas, S; Karazija, R

2007-01-01

The origin of the intense emission band at about 5 nm, dominating the emission spectra of tungsten ions in the ASDEX Upgrade tokamak and EBIT, is discussed. It is shown that the emission spectra of various ions calculated taking into account only the excitations from the ground level agree fairly well with the results obtained in the collisional-radiative model; thus, the contribution of the excitations from the other levels is small. Though the excitation spectrum for all sequence of ions W 29+ -W 37+ corresponds to the same transitions 4p 6 4d N → 4p 5 4d N+1 + 4p 6 4d N-1 4f, its energetic width essentially changes going on from the charge of ion q = 34 to q = 35. It is caused by the appearance of the excitations 4p 1/2 -4d 3/2 to the open 4d N 3/2 subshell, which are not quenched by configuration mixing. The satellite line at about 4.5 nm is explained by the transitions of the same type, although between configurations with one spectator 5s electron. The existence of one more group of intense lines in the region of 2 nm, corresponding to 5s-4p transitions, is predicted

Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS)

International Nuclear Information System (INIS)

Ewinger, H.P.

1993-05-01

This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C 2 , CH 2 , C 2 H, and C 3 , as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with suitable signal patterns. (orig./BBR) [de

Real-Time Online Monitoring of the Ion Range by Means of Prompt Secondary Radiations

International Nuclear Information System (INIS)

Krimmer, J.; Balleyguier, L.; Caponetto, L.; Chen, X.; Dahoumane, M.; Dauvergne, D.; De Rydt, M.; Dedes, G.; Della Negra, R.; Deng, S.M.; Ley, J.L.; Mathez, H.; Pinto, M.; Ray, C.; Richard, M.H.; Reithinger, V.; Roellinghoff, F.; Testa, E.; Zoccarato, Y.; Baudot, J.; Winter, M.; Brons, S.; Chabot, M.; Force, P.; Joly, B.; Insa, C.; Lambert, D.; Lestand, L.; Magne, M.; Montarou, G.; Freud, N.; Letang, J.M.; Lojacono, X.; Maxim, V.; Prostk, R.; Herault, J.; La Tessa, C.; Pleskac, R.; Vanstalle, M.; Parodi, K.; Prieels, D.; Smeets, J.; Rinaldi, I.

2013-06-01

Prompt secondary radiations such as gamma rays and protons can be used for ion-range monitoring during ion therapy either on an energy-slice basis or on a pencil-beam basis. We present a review of the ongoing activities in terms of detector developments, imaging, experimental and theoretical physics issues concerning the correlation between the physical dose and hadronic processes. (authors)

Ion cyclotron emission due to collective instability of fusion products and beam ions in TFTR and JET

International Nuclear Information System (INIS)

Dendy, R.O.; McClements, K.G.; Lashmore Davies, C.N.; Cottrell, G.A.; Majeski, R.; Cauffman, S.

1995-01-01

Ion cyclotron emission (ICE) has been observed from neutral beam heated TFTR and JET tritium experiments at sequential cyclotron harmonics of both fusion products and beam ions. The emission originates from the outer midplane plasma, where fusion products and beam ions are likely to have a drifting ring-type velocity-space distribution that is anisotropic and sharply peaked. Fusion product driven ICE can be attributed to the magnetoacoustic cyclotron instability, which involves the excitation of obliquely propagating waves on the fast Alfven/ion Bernstein branch at cyclotron harmonics of the fusion products. Differences between ICE observations in JET and TFTR appear to reflect the sensitivity of the instability growth rate to the ratio υ birth /c A , where υ birth is the fusion product birth speed and c A is the local Alfven speed: for fusion products in the outer midplane edge of TFTR supershots, υ birth A ; for alpha particles in the outer midplane edge of JET, the opposite inequality applies. If sub-Alfvenic fusion products are isotropic or have undergone even a moderate degree of thermalization, the magnetoacoustic instability cannot occur. In contrast, the super-Alfvenic alpha particles that are present in the outer midplane of JET can drive the magnetoacoustic cyclotron instability even if they are isotropic or have a relatively broad distribution of speeds. These conclusions may account for the observation that fusion product driven ICE in JET persists for longer than fusion product driven ICE in TFTR. A separate mechanism is proposed for the excitation of beam driven ICE in TFTR: electrostatic ion cyclotron harmonic waves, supported by strongly sub-Alfvenic beam ions, can be destabilized by a low concentration of such ions with a very anrrow spread of velocities in the parallel direction. 25 refs, 14 figs

Monte-Carlo simulations of secondary electron emission from CsI, induced by 1-10 keV X-rays and electrons

International Nuclear Information System (INIS)

Akkerman, A.; Gibrekhterman, A.; Breskin, A.; Chechik, R.

1992-05-01

A model for electron transport and emission in CsI is proposed. It is based on theoretically calculated microscopic cross-sections for electron interaction with the nuclear and the electronic components of the solid. A Monte Carlo program based on this model was developed to simulate secondary electron emission induced by X-rays and electrons in the energy range of 1 to 10 keV. The calculated secondary emission yields agree with existing experimental data. The model provides all necessary characteristics for the design of radiation detectors based on secondary electron emission. It can be expanded to higher incident energies and other alkali halides. (author)

Near UV-visible line emission from tungsten highly-charged ions in Large Helical Device

International Nuclear Information System (INIS)

Kato, D.; Sakaue, H.A.; Murakami, I.; Goto, M.; Oishi, T.; Morita, S.; Fujii, K.; Nakamura, N.; Koike, F.; Sasaki, Akira; Ding, X.-B.; Dong, C.-Z.

2015-01-01

Wavelengths of emission lines from tungsten highly-charged ions have been precisely measured in near UV-visible range (320 - 356 nm and 382 - 402 nm) at Large Helical Device (LHD) by tungsten pellet injection. The tungsten emission lines were assigned based on its line-integrated intensity profiles on a poloidal cross section. The ground-term magnetic-dipole (M1) lines of W 26+,27+ and an M1 line of a metastable excited state of W 28+ , whose wavelengths have been determined by measurements using electron-beam-ion-traps (EBITs), are identified in the LHD spectra. The present results partially compliment wavelength data of tungsten highly-charged ions in the near UV-visible range. (author)

SECONDARY EMISSION FROM NON-SPHERICAL DUST GRAINS WITH ROUGH SURFACES: APPLICATION TO LUNAR DUST

International Nuclear Information System (INIS)

Richterová, I.; Němeček, Z.; Beránek, M.; Šafránková, J.; Pavlů, J.

2012-01-01

Electrons impinging on a target can release secondary electrons and/or they can be scattered out of the target. It is well established that the number of escaping electrons per primary electron depends on the target composition and dimensions, the energy, and incidence angle of the primary electrons, but there are suggestions that the target's shape and surface roughness also influence the secondary emission. We present a further modification of the model of secondary electron emission from dust grains which is applied to non-spherical grains and grains with defined surface roughness. It is shown that the non-spherical grains give rise to a larger secondary electron yield, whereas the surface roughness leads to a decrease in the yield. Moreover, these effects can be distinguished: the shape effect is prominent for high primary energies, whereas the surface roughness predominantly affects the yield at the low-energy range. The calculations use the Lunar Highlands Type NU-LHT-2M simulant as a grain material and the results are compared with previously published laboratory and in situ measurements.

Enhanced 1.53 μm emission of Er{sup 3+} ions in phosphate glass via energy transfer from Cu{sup +} ions

Energy Technology Data Exchange (ETDEWEB)

Jiménez, José A., E-mail: jose.jimenez@unf.edu [Department of Chemistry, University of North Florida, Jacksonville, Florida 32224 (United States); Sendova, Mariana [Optical Spectroscopy and Nano-Materials Lab, New College of Florida, Sarasota, Florida 34243 (United States)

2014-07-21

Optimizing the efficiency of Er{sup 3+} emission in the near-infrared telecommunication window in glass matrices is currently a subject of great interest in photonics research. In this work, Cu{sup +} ions are shown to be successfully stabilized at a high concentration in Er-containing phosphate glass by a single-step melt-quench method, and demonstrated to transfer energy to Er{sup 3+} thereby enhancing the near-infrared emission about 15 times. The spectroscopic data indicate an energy conversion process where Cu{sup +} ions first absorb photons broadly around 360 nm and subsequently transfer energy from the Stokes-shifted emitting states to resonant Er{sup 3+} absorption transitions in the visible. Consequently, the Er{sup 3+} electronic excited states decay and the {sup 4}I{sub 3/2} metastable state is populated, leading to the enhanced emission at 1.53 μm. Monovalent copper ions are thus recognized as sensitizers of Er{sup 3+} ions, suggesting the potential of Cu{sup +} co-doping for applications in the telecommunications, solar cells, and solid-state lasing realizable under broad band near-ultraviolet optical pumping.

Glucose-Treated Manganese Hexacyanoferrate for Sodium-Ion Secondary Battery

Directory of Open Access Journals (Sweden)

Yutaka Moritomo

2015-09-01

Full Text Available Manganese hexacyanoferrate (Mn-PBA is a promising cathode material forsodium-ion secondary battery (SIB with high average voltage (=3.4 V against Na. Here,we find that the thermal decomposition of glucose modifies the surface state of Mn-PBA,without affecting the bulk crystal structure. The glucose treatment significantly improves therate properties of Mn-PBA in SIB. The critical discharge rate increases from 1 C (as-grownto 15 C (glucose-treated. Our observation suggests that thermal treatment is quite effectivefor insulating coordination polymers.

Trapping and re-emission of energetic hydrogen and helium ions in materials

International Nuclear Information System (INIS)

Yamaguchi, Sadae

1981-01-01

The experimental results on the trapping and re-emission of energetic hydrogen and helium ions in materials are explained. The trapping of deuterium and helium in graphite saturates at the concentration of 10 18 ions/cm 2 . The trapping rate of hydrogen depends on the kinds of target materials. In the case of the implantation in Mo over 3 x 10 16 H/cm 2 , hydrogen is hardly trapped. On the other hand, the trapping of hydrogen in Ti, Zr and Ta which form solid solution is easily made. The hydrogen in these metals can diffuse toward the inside of metals. The deuterium retained in 316 SS decreased with time. The trapping rate reached saturation more rapidly at higher implantation temperature. The effective diffusion constant for the explanation of the re-emission process is 1/100 as small as the ordinary value. The radiation damage due to helium irradiation affects on the trapping of deuterium in Mo. The temperature dependence of the trapping rate can be explained by the diffusion model based on the Sievert's law. The re-emission of helium was measured at various temperature. At low temperature, the re-emission was low at first, then the rate increased. At high temperature, the re-emission rate was high from the beginning. (Kato, T.)

An algorithm to calculate secondary sputtering by the reflection of ions in two dimensions

International Nuclear Information System (INIS)

Smith, R.; Tagg, M.A.

1986-01-01

A method for computing the secondary sputtering of ions reflected from two-dimensional surfaces is described. The surface contour is first approximated by a set of line segments and the displacement of these line segments under ion erosion is determined computationally, by summing the contributions of the primary and reflected fluxes. This method can be used as an alternative to the method of characteristics which is normally used to determine primary ion beam effects. Some simple examples are evaluated. These examples illustrate that primary surface erosion theory is not in itself sufficient to explain the topography which can exist on an ion-eroded surface, particularly close to steep-sided structures. (author)

Contributions of secondary fragmentation by carbon ion beams in water phantom: Monte Carlo simulation

International Nuclear Information System (INIS)

Ying, C K; Bolst, David; Tran, Linh T.; Guatelli, Susanna; Rosenfeld, A. B.; Kamil, W A

2017-01-01

Heavy-particle therapy such as carbon ion therapy is currently very popular because of its superior conformality in terms of dose distribution and higher Relative Biological Effectiveness (RBE). However, carbon ion beams produce a complex mixed radiation field, which needs to be fully characterised. In this study, the fragmentation of a 290 MeV/u primary carbon ion beam was studied using the Geant4 Monte Carlo Toolkit. When the primary carbon ion beam interacts with water, secondary light charged particles (H, He, Li, Be, B) and fast neutrons are produced, contributing to the dose, especially after the distal edge of the Bragg peak. (paper)

Gasoline emissions dominate over diesel in formation of secondary organic aerosol mass

Science.gov (United States)

Bahreini, R.; Middlebrook, A. M.; de Gouw, J. A.; Warneke, C.; Trainer, M.; Brock, C. A.; Stark, H.; Brown, S. S.; Dube, W. P.; Gilman, J. B.; Hall, K.; Holloway, J. S.; Kuster, W. C.; Perring, A. E.; Prevot, A. S. H.; Schwarz, J. P.; Spackman, J. R.; Szidat, S.; Wagner, N. L.; Weber, R. J.; Zotter, P.; Parrish, D. D.

2012-03-01

Although laboratory experiments have shown that organic compounds in both gasoline fuel and diesel engine exhaust can form secondary organic aerosol (SOA), the fractional contribution from gasoline and diesel exhaust emissions to ambient SOA in urban environments is poorly known. Here we use airborne and ground-based measurements of organic aerosol (OA) in the Los Angeles (LA) Basin, California made during May and June 2010 to assess the amount of SOA formed from diesel emissions. Diesel emissions in the LA Basin vary between weekdays and weekends, with 54% lower diesel emissions on weekends. Despite this difference in source contributions, in air masses with similar degrees of photochemical processing, formation of OA is the same on weekends and weekdays, within the measurement uncertainties. This result indicates that the contribution from diesel emissions to SOA formation is zero within our uncertainties. Therefore, substantial reductions of SOA mass on local to global scales will be achieved by reducing gasoline vehicle emissions.

Energetic ion emission in a positive polarity nanosecond plasma opening switch

Energy Technology Data Exchange (ETDEWEB)

Sarfaty, M [Univ. of Wisconsin, Madison, WI (United States); Krasik, Ya E; Weingarten, A; Fruchtman, A; Maron, Y [Weizmann Institute of Science, Rehovot (Israel). Department of Physics

1997-12-31

The emission was studied of energetic ions from the plasma in a coaxial Plasma Opening Switch (POS) powered by a 300 kV, 15 kA, 90 ns positive polarity pulse. Fluxes lasting 2 - 3 ns of ions flowing radially onto the cathode were observed at all axial locations of the switch plasma within 5 ns of the beginning of the upstream POS current. It is suggested that the termination of this ion flux is due to the formation of a cathode plasma, which is consistent with our spectroscopic measurements. Later in the pulse, longer duration (100 ns) ion fluxes were observed radially, first appearing in the generator side of the switch plasma. Fluxes 30 - 40 ns long of ions flowing axially towards the POS load at velocities (2{+-}1) x 10{sup 8} cm/s were also observed. The dependences of the start time of the axial ion flow, of the ion velocities, and of the ion flux on the POS operation parameters were studied. (author). 6 figs., 5 refs.

Energetic ion emission in a positive polarity nanosecond plasma opening switch

International Nuclear Information System (INIS)

Sarfaty, M.; Krasik, Ya.E.; Weingarten, A.; Fruchtman, A.; Maron, Y.

1996-01-01

The emission was studied of energetic ions from the plasma in a coaxial Plasma Opening Switch (POS) powered by a 300 kV, 15 kA, 90 ns positive polarity pulse. Fluxes lasting 2 - 3 ns of ions flowing radially onto the cathode were observed at all axial locations of the switch plasma within 5 ns of the beginning of the upstream POS current. It is suggested that the termination of this ion flux is due to the formation of a cathode plasma, which is consistent with our spectroscopic measurements. Later in the pulse, longer duration (100 ns) ion fluxes were observed radially, first appearing in the generator side of the switch plasma. Fluxes 30 - 40 ns long of ions flowing axially towards the POS load at velocities (2±1) x 10 8 cm/s were also observed. The dependences of the start time of the axial ion flow, of the ion velocities, and of the ion flux on the POS operation parameters were studied. (author). 6 figs., 5 refs

The development of pulsed ion sources with explosive ions emission for deposition of films and coatings with ion and electron mixing

International Nuclear Information System (INIS)

Korenev, S.

1998-01-01

The development of pulsed ion sources with explosive ion emission for deposition of films and coatings with ion and electron mixing is considered in the report. The deposition of films and coatings with high hardness and high resistance on the basis using this source on the working voltage 50--100 kV is presented. The deposition of TiB(2), W and other films is discussed and comparison with other results. The experimental results of pulsed electron/ion mixing are considered. The main characteristics of these films and coating are considered. The cluster mechanism of deposition of films and coatings are discussed. The main question of structure of these films on the basis of surface cluster fractal structure is suggested and discussed. The study of structure of these films showed the new kind of structure of these films and coatings

Secondary particle tracks generated by ion beam irradiation

Science.gov (United States)

García, Gustavo

2015-05-01

The Low Energy Particle Track Simulation (LEPTS) procedure is a powerful complementary tool to include the effect of low energy electrons and positrons in medical applications of radiation. In particular, for ion-beam cancer treatments provides a detailed description of the role of the secondary electrons abundantly generated around the Bragg peak as well as the possibility of using transmuted positron emitters (C11, O15) as a complement for ion-beam dosimetry. In this study we present interaction probability data derived from IAM-SCAR corrective factors for liquid environments. Using these data, single electron and positron tracks in liquid water and pyrimidine have been simulated providing information about energy deposition as well as the number and type of interactions taking place in any selected ``nanovolume'' of the irradiated area. In collaboration with Francisco Blanco, Universidad Complutense de Madrid; Antonio Mu noz, Centro de Investigaciones Energéticas Medioambientales y Tecnológicas and Diogo Almeida, Filipe Ferreira da Silva, Paulo Lim ao-Vieira, Universidade Nova de Lisboa. Supported by the Spanish and Portuguese governments.

Secondary Electron Emission from Dust and Its Effect on Charging

Science.gov (United States)

Saikia, B. K.; Kakati, B.; Kausik, S. S.; Bandyopadhyay, M.

2011-11-01

Hydrogen plasma is produced in a plasma chamber by striking discharge between incandescent tungsten filaments and the permanent magnetic cage [1], which is grounded. The magnetic cage has a full line cusped magnetic field geometry used to confine the plasma elements. A cylindrical Langmuir probe is used to study the plasma parameters in various discharge conditions. The charge accumulated on the dust particles is calculated using the capacitance model and the dust current is measured by the combination of a Faraday cup and an electrometer at different discharge conditions. It is found Secondary electron emission from dust having low emission yield effects the charging of dust particles in presence of high energetic electrons.

Secondary Electron Emission from Dust and Its Effect on Charging

International Nuclear Information System (INIS)

Saikia, B. K.; Kakati, B.; Kausik, S. S.; Bandyopadhyay, M.

2011-01-01

Hydrogen plasma is produced in a plasma chamber by striking discharge between incandescent tungsten filaments and the permanent magnetic cage [1], which is grounded. The magnetic cage has a full line cusped magnetic field geometry used to confine the plasma elements. A cylindrical Langmuir probe is used to study the plasma parameters in various discharge conditions. The charge accumulated on the dust particles is calculated using the capacitance model and the dust current is measured by the combination of a Faraday cup and an electrometer at different discharge conditions. It is found Secondary electron emission from dust having low emission yield effects the charging of dust particles in presence of high energetic electrons.

Fundamental properties of field emission-driven direct current microdischarges

International Nuclear Information System (INIS)

Rumbach, Paul; Go, David B.

2012-01-01

For half a century, it has been known that the onset of field emission in direct current microdischarges with gap sizes less than 10 μm can lead to breakdown at applied voltages far less than predicted by Paschen's law. It is still unclear how field emission affects other fundamental plasma properties at this scale. In this work, a one-dimensional fluid model is used to predict basic scaling laws for fundamental properties including ion density, electric field due to space charge, and current-voltage relations in the pre-breakdown regime. Computational results are compared with approximate analytic solutions. It is shown that field emission provides an abundance of cathode electrons, which in turn create large ion concentrations through ionizing collisions well before Paschen's criterion for breakdown is met. Breakdown due to ion-enhanced field emission occurs when the electric field due to space charge becomes comparable to the applied electric field. Simple scaling analysis of the 1D Poisson equation demonstrates that an ion density of n + ≈ 0.1V A ε 0 /qd 2 is necessary to significantly distort the electric field. Defining breakdown in terms of this critical ion density leads analytically to a simple, effective secondary emission coefficient γ ′ of the same mathematical form initially suggested by Boyle and Kisliuk [Phys. Rev. 97, 255 (1955)].

Measurement of the secondary electron emission from CVD diamond films using phosphor screen detectors

Science.gov (United States)

Vaz, R.; May, P. W.; Fox, N. A.; Harwood, C. J.; Chatterjee, V.; Smith, J. A.; Horsfield, C. J.; Lapington, J. S.; Osbourne, S.

2015-03-01

Diamond-based photomultipliers have the potential to provide a significant improvement over existing devices due to diamond's high secondary electron yield and narrow energy distribution of secondary electrons which improves energy resolution creating extremely fast response times. In this paper we describe an experimental apparatus designed to study secondary electron emission from diamond membranes only 400 nm thick, observed in reflection and transmission configurations. The setup consists of a system of calibrated P22 green phosphor screens acting as radiation converters which are used in combination with photomultiplier tubes to acquire secondary emission yield data from the diamond samples. The superior signal voltage sampling of the phosphor screen setup compared with traditional Faraday Cup detection allows the variation in the secondary electron yield across the sample to be visualised, allowing spatial distributions to be obtained. Preliminary reflection and transmission yield data are presented as a function of primary electron energy for selected CVD diamond films and membranes. Reflection data were also obtained from the same sample set using a Faraday Cup detector setup. In general, the curves for secondary electron yield versus primary energy for both measurement setups were comparable. On average a 15-20% lower signal was recorded on our setup compared to the Faraday Cup, which was attributed to the lower photoluminescent efficiency of the P22 phosphor screens when operated at sub-kilovolt bias voltages.

Various light particles emissions accompaning light heavy ion collisions

International Nuclear Information System (INIS)

Billerey, R.

1981-01-01

In this work we have investigated light particles emission accompanying heavy-ion induced reactions. The experiments were performed at the isochronous cyclotron of the I.S.N. de Grenoble and we got in and out of plane correlations between solid state and gazeous detectors. In 14 N (100 MeV) + 27 Al we have chosen, light particles emitted in coincidence with deep inelastic fragments or evaporation residues have been measured. Likewise we observed the correlations between fragments and fragments. The particularities we found between protons and alpha emissions are to be assigned to differences in separation energies, but their relative energies and angular momenta have also a significant part [fr

Electron Emission by N6+ Ions Scattered at a Magnetized Iron Surface

International Nuclear Information System (INIS)

Solleder, B.; Lemell, C.; Burgdoerfer, J.; Tokesi, K.

2006-01-01

Complete text of publication follows. Magnetized materials are of considerable interest in the electronics industry (hard discs, spintronics, etc.). A detailed understanding of the properties of magnetized surfaces is therefore important to optimize technical applications. In the last decades, different experimental techniques have been developed to probe spin effects in magnetized materials. In this work the spin polarization of electrons emitted during the impact of N 6+ ions on a magnetized Fe surface is investigated. We study potential emission (PE) of electrons as well as secondary electron (SE) production and transport in the target with the help of Monte Carlo (MC) simulations. Spin dependence of electron transfer processes and of transport in the solid are included. Fig. 1 shows the results of our simulation for the energy distribution and spin polarization of emitted electrons in comparison with experimental data of Pfandzelter et al. [1] for the interaction of N 6+ ions with magnetized Fe. Electrons with energies higher than 200 eV are predominantly PE electrons, emitted close to the surface via autoionization (AI), Auger capture (AC) and Auger deexcitation (AD) channels. Low energy electrons are dominated by promoted, autoionized, and secondary electrons. The polarization of above surface electrons is determined by the high of the potential barrier separating projectile and target. At large distances, the barrier drops only slightly below the Fermi edge and enables transitions of electrons from this part of the band structure which has about 50% polarization. These electrons are transferred to high n states feeding promotion and AI processes between high lying states. Electrons emitted by these processes therefore reflect the polarization near the Fermi edge. Close to the surface, the barrier is low enough to allow for electron capture from the entire conduction band. K-Auger electrons are emitted in immediate vicinity of the surface and therefore mirror

Enhanced flashover strength in polyethylene nanodielectrics by secondary electron emission modification

Directory of Open Access Journals (Sweden)

Weiwang Wang

2016-04-01

Full Text Available This work studies the correlation between secondary electron emission (SEE characteristics and impulse surface flashover in polyethylene nanodielectrics both theoretically and experimentally, and illustrates the enhancement of flashover voltage in low-density polyethylene (LDPE through incorporating Al2O3 nanoparticles. SEE characteristics play key roles in surface charging and gas desorption during surface flashover. This work demonstrates that the presence of Al2O3 nanoparticles decreases the SEE coefficient of LDPE and enhances the impact energy at the equilibrium state of surface charging. These changes can be explained by the increase of surface roughness and of surface ionization energy, and the strong interaction between nanoparticles and the polymer dielectric matrix. The surface charge and flashover voltage are calculated according to the secondary electron emission avalanche (SEEA model, which reveals that the positive surface charges are reduced near the cathode triple point, while the presence of more nanoparticles in high loading samples enhances the gas desorption. Consequently, the surface flashover performance of LDPE/Al2O3 nanodielectrics is improved.

Co-Registered In Situ Secondary Electron and Mass Spectral Imaging on the Helium Ion Microscope Demonstrated Using Lithium Titanate and Magnesium Oxide Nanoparticles.

Science.gov (United States)

Dowsett, D; Wirtz, T

2017-09-05

The development of a high resolution elemental imaging platform combining coregistered secondary ion mass spectrometry and high resolution secondary electron imaging is reported. The basic instrument setup and operation are discussed and in situ image correlation is demonstrated on a lithium titanate and magnesium oxide nanoparticle mixture. The instrument uses both helium and neon ion beams generated by a gas field ion source to irradiate the sample. Both secondary electrons and secondary ions may be detected. Secondary ion mass spectrometry (SIMS) is performed using an in-house developed double focusing magnetic sector spectrometer with parallel detection. Spatial resolutions of 10 nm have been obtained in SIMS mode. Both the secondary electron and SIMS image data are very surface sensitive and have approximately the same information depth. While the spatial resolutions are approximately a factor of 10 different, switching between the different images modes may be done in situ and extremely rapidly, allowing for simple imaging of the same region of interest and excellent coregistration of data sets. The ability to correlate mass spectral images on the 10 nm scale with secondary electron images on the nanometer scale in situ has the potential to provide a step change in our understanding of nanoscale phenomena in fields from materials science to life science.

Plasma ion emission from high intensity picosecond laser pulse interactions with solid targets

International Nuclear Information System (INIS)

Fews, A.P.; Norreys, P.A.; Beg, F.N.; Bell, A.R.; Dangor, A.E.; Danson, C.N.; Lee, P.; Rose, S.J.

1994-01-01

The fast ion emission from high intensity, picosecond laser plasmas has been measured to give the characteristic ion energy and the amount of laser energy transferred to ions with energies ≥100 keV/nucleon as a function of incident intensity. The characteristic ion energy varies from 0.2 to 1.3 MeV over the range 2.0x10 17 --2.0x10 18 W cm -2 . Ten percent of the laser energy is transferred into MeV ions at 2.0x10 18 W cm -2 . Calculations of stopping power in high density materials are presented that show that fast ions cannot be ignored in modeling fast ignitor schemes

Improved age-diffusion model for low-energy electron transport in solids. II. Application to secondary emission from aluminum

International Nuclear Information System (INIS)

Dubus, A.; Devooght, J.; Dehaes, J.C.

1987-01-01

The ''improved age-diffusion'' model for secondary-electron transport is applied to aluminum. Electron cross sections for inelastic collisions with the free-electron gas using the Lindhard dielectric function and for elastic collisions with the randomly distributed ionic cores are used in the calculations. The most important characteristics of backward secondary-electron emission induced by low-energy electrons on polycrystalline Al targets are calculated and compared to experimental results and to Monte Carlo calculations. The model appears to predict the electronic yield, the energy spectra, and the spatial dependence of secondary emission with reasonable accuracy

EVIDENCE FOR SECONDARY EMISSION AS THE ORIGIN OF HARD SPECTRA IN TeV BLAZARS

International Nuclear Information System (INIS)

Zheng, Y. G.; Kang, T.

2013-01-01

We develop a model for the possible origin of hard, very high energy (VHE) spectra from a distant blazar. In the model, both the primary photons produced in the source and secondary photons produced outside it contribute to the observed high-energy γ-ray emission. That is, the primary photons are produced through the synchrotron self-Compton process, and the secondary photons are produced through high-energy proton interactions with background photons along the line of sight. We apply the model to a characteristic case of VHE γ-ray emission in the distant blazar 1ES 1101-232. Assuming suitable electron and proton spectra, we obtain excellent fits to the observed spectra of this blazar. This indicated that the surprisingly low attenuation of the high-energy γ-rays, especially the shape of the VHE γ-ray tail of the observed spectra, can be explained by secondary γ-rays produced in interactions of cosmic-ray protons with background photons in intergalactic space.

Very High Radiation Detector for the LHC BLM System Based on Secondary Electron Emission

CERN Document Server

Dehning, B; Holzer, EB; Kramer, D

2007-01-01

Beam Loss Monitoring (BLM) system plays a vital role in the active protection of the LHC accelerators elements. It should provide the number of particles lost from the primary hadron beam by measuring the radiation field induced by their interaction with matter surrounding the beam pipe. The LHC BLM system will use ionization chambers as standard detectors but in the areas where very high dose rates are expected, the Secondary Emission Monitor (SEM) chambers will be employed because of their high linearity, low sensitivity and fast response. The SEM needs a high vacuum for proper operation and has to be functional for up to 20 years, therefore all the components were designed according to the UHV requirements and a getter pump was included. The SEM electrodes are made of Ti because of its Secondary Emission Yield (SEY) stability. The sensitivity of the SEM was modeled in Geant4 via the Photo-Absorption Ionization module together with custom parameterization of the very low energy secondary electron production...

Energy Transfer Efficiency from ZnO-Nanocrystals to Eu3+ Ions Embedded in SiO₂ Film for Emission at 614 nm.

Science.gov (United States)

Mangalam, Vivek; Pita, Kantisara

2017-08-10

In this work, we study the energy transfer mechanism from ZnO nanocrystals (ZnO-nc) to Eu 3+ ions by fabricating thin-film samples of ZnO-nc and Eu 3+ ions embedded in a SiO₂ matrix using the low-cost sol-gel technique. The time-resolved photoluminescence (TRPL) measurements from the samples were analyzed to understand the contribution of energy transfer from the various ZnO-nc emission centers to Eu 3+ ions. The decay time obtained from the TRPL measurements was used to calculate the energy transfer efficiencies from the ZnO-nc emission centers, and these results were compared with the energy transfer efficiencies calculated from steady-state photoluminescence emission results. The results in this work show that high transfer efficiencies from the excitonic and Zn defect emission centers is mostly due to the energy transfer from ZnO-nc to Eu 3+ ions which results in the radiative emission from the Eu 3+ ions at 614 nm, while the energy transfer from the oxygen defect emissions is most probably due to the energy transfer from ZnO-nc to the new defects created due to the incorporation of the Eu 3+ ions.

Ion plasma electron gun

International Nuclear Information System (INIS)

Wakalopulos, G.

1976-01-01

In the disclosed electron gun positive ions generated by a hollow cathode plasma discharge in a first chamber are accelerated through control and shield grids into a second chamber containing a high voltage cold cathode. These positive ions bombard a surface of the cathode causing the cathode to emit secondary electrons which form an electron beam having a distribution adjacent to the cathode emissive surface substantially the same as the distribution of the ion beam impinging upon the cathode. After passing through the grids and the plasma discharge chamber, the electron beam exits from the electron gun via a foil window. Control of the generated electron beam is achieved by applying a relatively low control voltage between the control grid and the electron gun housing (which resides at ground potential) to control the density of the positive ions bombarding the cathode

Quantization of secondary ion mass spectrometry (SIMS) data using external and internal standards

International Nuclear Information System (INIS)

Gnaser, H.

1983-01-01

Some aspects of multi-dimensional characterization of solids by secondary ion mass spectrometry (SIMS) are given. A theoretical part discusses methods for the quantization of SIMS data and the most prominent effects of ion-solid interactions as related to SIMS. After a description of the instrument used for experiments (a quadrupole-equipped ion microprobe featuring a liquid metal ion source in addition to the standard duoplasmatron gas ion source) the first experimental section is devoted to the determination of practical sensitivities and relative sensitivity factors for selected pure elements, binary and treary alloys and multicomponent systems. For 23 pure elements practical sensitivities under O + 2 bombardment also have been compared to those under In + -bombardment; it was shown that on oxygen saturated surfaces yields under In + -bombardment are higher, this making feasible use of submicron In-beams for surface analysis. In the second experimental section boron implants in silicon have been used for studying depth profiling capabilities of the instrument. Sputtering yields of Si and degrees of ionization of both B and Si have been measured. It has been shown that implantation profiles may deviate considerably from Gaussian but can be described by means of mathematical distribution functions. In the third experimental section depth resolution of the erosion process has been studied by profiling a Ni/Cr multilayer sample (100 A single layer) and been found to be approximately constant over the depth range investigated. Quantization of depth profiles, usually distorted by matrix effects, has been attempted using the primary beam species (In) as internal implantation standard. Some problems in connection with the conversion of secondary ion micrographs to concentration maps are discussed. Elemental detection limits in multidimensional SIMS analysis are given in dependence of primary beam size and total eroded depth. (Author)

Pyrene-Phosphonate Conjugate: Aggregation-Induced Enhanced Emission, and Selective Fe3+ Ions Sensing Properties

Directory of Open Access Journals (Sweden)

Sachin D. Padghan

2017-08-01

Full Text Available A new pyrene-phosphonate colorimetric receptor 1 has been designed and synthesized in a one-step process via amide bond formation between pyrene butyric acid chloride and phosphonate-appended aniline. The pyrene-phosphonate receptor 1 showed aggregation-induced enhanced emission (AIEE properties in water/acetonitrile (ACN solutions. Dynamic light scattering (DLS characterization revealed that the aggregates of receptor 1 at 80% water fraction have an average size of ≈142 nm. Field emission scanning electron microscopy (FE-SEM analysis confirmed the formation of spherical aggregates upon solvent evaporation. The sensing properties of receptor 1 were investigated by UV-vis, fluorescence emission spectroscopy, and other optical methods. Among the tested metal ions, receptor 1 is capable of recognizing the Fe3+ ion selectively. The changes in spectral measurements were explained on the basis of complex formation. The composition of receptor 1 and Fe3+ ions was determined by using Job’s plot and found to be 1:1. The receptor 1–Fe3+ complex showed a reversible UV-vis response in the presence of EDTA.

Effective tuning of the ratio of red to green emission of Ho"3"+ ions in single LiLuF_4 microparticle via codoping Ce"3"+ ions

International Nuclear Information System (INIS)

Gao, Wei; Dong, Jun; Liu, Jihong; Yan, Xuewen

2016-01-01

Yb"3"+/Ho"3"+ codoped LiLuF_4 microparticles have been successfully prepared via a facile hydrothermal method. The crystal phase and morphology of LiLuF_4 microparticles were inspected by x-ray diffraction and scanning electron microscope, respectively. The upconversion emission of single LiLuF_4: Yb"3"+/Ho"3"+ microparticle was carefully studied by a confocal microscopy setup under NIR 980 nm excitation. With the increase of Ce"3"+ ion concentrations of 12%, the ratio of red to green emission of the Ho"3"+ ions of single LiLuF_4 microparticle was boosted about 17-fold, and the output colors were tuned from green to red, which is due to the two efficient cross-relaxation between Ho"3"+ and Ce"3"+ ions enhances the red and suppresses the green in the emission processes. To investigate the optical properties of the single microparticle or nanoparticle through the confocal microscopy setup can effectively avoid the influence of surrounding particle or environment, and could provide more precise information for better exploring the emission mechanisms of rare earth ions. The tunable upconversion emission of Ho"3"+ in single LiLuF_4 microparticle in this work will have great potential applications in the micro optoelectronic devices and color display applications. - Highlights: • The optical properties of the single LiLuF4: Yb3+/Ho3+/Ce3+ microparticle were studied. • The output colors of single LiLuF4 microparticle were tuned from green to red. • The upconversion mechanisms between Ho3+ and Ce3+ ions were discussed based on emission spectrum.

Surrey Ion Beam Centre: the EPSRC MRF for ion beam applications - 01002

International Nuclear Information System (INIS)

Webb, R.P.

2016-01-01

The SIBC (Surrey Ion Beam Centre) is an element of the Virtual Ion Beam Centre that coordinates 3 U.K. experimental facilities: SIBC (University of Surrey) for implantation and ion beam applications, Miami and MEIS facility (University of Huddersfield) and gamma ray and neutron irradiation emulation facility (University of Manchester). The SIBC works actively with industry, developing bespoke processes and services, particularly for the photonics industry and provides ion beam facilities to about 20 companies across the world. It operates a stringent quality control program and is one of the few ion beam laboratories in the world to operate under ISO 9001 certification. The equipment of SIBC is presented and some applications of ion beam analysis concerning the identification of gunshot residues, the determination of the origin of a painting, the analysis of proteins are described. Different techniques such as PIXE (Particle Induced X-ray Emission), RBS (Rutherford Backscattering Spectroscopy), NRA (Nuclear Reaction Analysis), SIMS (Secondary Ion Mass Spectrometry) are also explained in the slides of the presentation that have been added at the end of the paper

Carbon buildup monitoring using RBS: Correlation with secondary electrons

International Nuclear Information System (INIS)

Aguilera, E.F.; Rosales, P.; Martinez-Quiroz, E.; Murillo, G.; Fernandez, M.C.

2006-01-01

The RBS technique is applied to solve the problem of on-line monitoring of the carbon deposited on a thin backed foil under ion bombardment. An iterative method is used to reliably extract quantities such as number of projectiles and target thickness in spite of beam energy changes and detector unstabilities. Experimental values for secondary electron yields are also deduced. Results are reported for the thickness variation of thin carbon foils bombarded with carbon ions of energies between 8.95 and 13 MeV. A linear correlation of this variation is found with both, the ion fluence at target and the number of secondary electrons emitted. The correlation exists even though a wide range of beam currents, beam energies and bombarding times was used during the experiment. The measured electron yields show evidence for a change in the emission process between the original foils and the deposited layer, possibly due to a texture change

Low work-function thermionic emission and orbital-motion-limited ion collection at bare-tether cathodic contact

Energy Technology Data Exchange (ETDEWEB)

Chen, Xin, E-mail: xin.chen@upm.es; Sanmartín, J. R., E-mail: juanr.sanmartin@upm.es [Departamento de Física Aplicada, Escuela Técnica Superior de Ingeniería Aeronáutica y del Espacio, Universidad Politécnica de Madrid, Plaza Cardenal Cisneros, 3, 28040 Madrid (Spain)

2015-05-15

With a thin coating of low-work-function material, thermionic emission in the cathodic segment of bare tethers might be much greater than orbital-motion-limited (OML) ion collection current. The space charge of the emitted electrons decreases the electric field that accelerates them outwards, and could even reverse it for high enough emission, producing a potential hollow. In this work, at the conditions of high bias and relatively low emission that make the potential monotonic, an asymptotic analysis is carried out, extending the OML ion-collection analysis to investigate the probe response due to electrons emitted by the negatively biased cylindrical probe. At given emission, the space charge effect from emitted electrons increases with decreasing magnitude of negative probe bias. Although emitted electrons present negligible space charge far away from the probe, their effect cannot be neglected in the global analysis for the sheath structure and two thin layers in between sheath and the quasineutral region. The space-charge-limited condition is located. It is found that thermionic emission increases the range of probe radius for OML validity and is greatly more effective than ion collection for cathodic contact of tethers.

Experimental study of the organic ion intensity distribution in the ion imaging of coated polymer fibres with S-SIMS

International Nuclear Information System (INIS)

Vercammen, Yannick; Moons, Nicola; Van Nuffel, Sebastiaan; Beenaerts, Linda; Van Vaeck, Luc

2013-01-01

and curvature of the field lines, secondary ion emission angle and initial kinetic energy and difference in local surface potential due to the position in the extraction field and charge build-up during analysis.

Differential multi-electron emission induced by swift highly charged gold ions penetrating carbon foils

Science.gov (United States)

Rothard, H.; Moshammer, R.; Ullrich, J.; Kollmus, H.; Mann, R.; Hagmann, S.; Zouros, T. J. M.

2007-05-01

First results on swift heavy ion induced electron emission from solids obtained with a reaction microscope are presented. This advanced technique, which is successfully used since quite some time to study electron ejection in ion-atom collisions, combines the measurement of the time-of-flight of electrons with imaging techniques. A combination of electric and magnetic fields guides the ejected electrons onto a position sensitive detector, which is capable to accept multiple hits. From position and time-of-flight measurement the full differential emission characteristics of up to 10 electrons per single incoming ion can be extracted. As a first example, we show energy spectra, angular distributions and the multiplicity distribution of electrons from impact of Au24+ (11 MeV/u) on a thin carbon foil (28 μg/cm2).

Differential multi-electron emission induced by swift highly charged gold ions penetrating carbon foils

International Nuclear Information System (INIS)

Rothard, H.; Moshammer, R.; Ullrich, J.; Kollmus, H.; Mann, R.; Hagmann, S.; Zouros, T.J.M.

2007-01-01

First results on swift heavy ion induced electron emission from solids obtained with a reaction microscope are presented. This advanced technique, which is successfully used since quite some time to study electron ejection in ion-atom collisions, combines the measurement of the time-of-flight of electrons with imaging techniques. A combination of electric and magnetic fields guides the ejected electrons onto a position sensitive detector, which is capable to accept multiple hits. From position and time-of-flight measurement the full differential emission characteristics of up to 10 electrons per single incoming ion can be extracted. As a first example, we show energy spectra, angular distributions and the multiplicity distribution of electrons from impact of Au 24+ (11 MeV/u) on a thin carbon foil (28 μg/cm 2 )

Contribution of charge-transfer processes to ion-induced electron emission

International Nuclear Information System (INIS)

Roesler, M.; Garcia de Abajo, F.J.

1996-01-01

Charge changing events of ions moving inside metals are shown to contribute significantly to electron emission in the intermediate velocity regime via electrons coming from projectile ionization. Inclusion of equilibrium charge state fractions, together with two-electron Auger processes and resonant-coherent electron loss from the projectile, results in reasonable agreement with previous calculations for frozen protons, though a significant part of the emission is now interpreted in terms of charge exchange. The quantal character of the surface barrier transmission is shown to play an important role. The theory compares well with experimental observations for H projectiles. copyright 1996 The American Physical Society

The molecular mechanism of ion-dependent gating in secondary transporters.

Directory of Open Access Journals (Sweden)

Chunfeng Zhao

2013-10-01

Full Text Available LeuT-like fold Na-dependent secondary active transporters form a large family of integral membrane proteins that transport various substrates against their concentration gradient across lipid membranes, using the free energy stored in the downhill concentration gradient of sodium ions. These transporters play an active role in synaptic transmission, the delivery of key nutrients, and the maintenance of osmotic pressure inside the cell. It is generally believed that binding of an ion and/or a substrate drives the conformational dynamics of the transporter. However, the exact mechanism for converting ion binding into useful work has yet to be established. Using a multi-dimensional path sampling (string-method followed by all-atom free energy simulations, we established the principal thermodynamic and kinetic components governing the ion-dependent conformational dynamics of a LeuT-like fold transporter, the sodium/benzyl-hydantoin symporter Mhp1, for an entire conformational cycle. We found that inward-facing and outward-facing states of Mhp1 display nearly the same free energies with an ion absent from the Na2 site conserved across the LeuT-like fold transporters. The barrier separating an apo-state from inward-facing or outward-facing states of the transporter is very low, suggesting stochastic gating in the absence of ion/substrate bound. In contrast, the binding of a Na2 ion shifts the free energy stabilizing the outward-facing state and promoting substrate binding. Our results indicate that ion binding to the Na2 site may also play a key role in the intracellular thin gate dynamics modulation by altering its interactions with the transmembrane helix 5 (TM5. The Potential of Mean Force (PMF computations for a substrate entrance displays two energy minima that correspond to the locations of the main binding site S1 and proposed allosteric S2 binding site. However, it was found that substrate's binds to the site S1 ∼5 kcal/mol more favorable

Ionization, charge exchange, and secondary electron emission in the extractor of an LBL/LLL neutral beam source

International Nuclear Information System (INIS)

Fink, J.H.; McDowell, C.E.

1975-01-01

Using a computer code, bombardment of the electrodes resulting from ionization, charge-exchange, and back-ion emission from the neutralizer cell is studied in the positive-ion extractor region of a Lawrence Berkeley Laboratory/Lawrence Livermore Laboratory (LBL/LLL) neutral beam source. Ion and electron trajectories are presented, grid dissipations estimated, and proposals made for future designs

Electromagnetic Ion Cyclotron Waves in the Helium Branch Induced by Multiple Electromagnetic Ion Cyclotron Triggered Emissions

Science.gov (United States)

Shoji, M.; Omura, Y.; Grison, B.; Pickett, J. S.; Dandouras, I. S.; Engebretson, M. J.

2011-12-01

Electromagnetic ion cyclotron (EMIC) triggered emissions with rising tones between the H+ and He+ cyclotron frequencies were found in the inner magnetosphere by the recent Cluster observations. Another type of EMIC wave with a constant frequency is occasionally observed below the He+ cyclotron frequency after the multiple EMIC triggered emissions. We performed a self-consistent hybrid simulation with a one-dimensional cylindrical magnetic flux model approximating the dipole magnetic field of the Earth's inner magnetosphere. In the presence of energetic protons with a sufficient density and temperature anisotropy, multiple EMIC triggered emissions are reproduced due to the nonlinear wave growth mechanism of rising-tone chorus emissions, and a constant frequency wave in the He+ EMIC branch is subsequently generated. Through interaction with the multiple EMIC rising-tone emissions, the velocity distribution function of the energetic protons is strongly modified. Because of the pitch angle scattering of the protons, the gradient of the distribution in velocity phase space is enhanced along the diffusion curve of the He+ branch wave, resulting in the linear growth of the EMIC wave in the He+ branch.

Light charged particle emission in heavy-ion reactions – What have ...

Indian Academy of Sciences (India)

coincidence with gamma rays, fission products, evaporation residues have yielded interesting results which bring out the influence of nuclear structure, nuclear mean field and dynamics on the emission of these particles. Keywords. Light charged particles; heavy-ion induced reactions; particle spectra and angular distri-.

Theoretical progress in studying the characteristic x-ray emission from heavy few-electron ions

International Nuclear Information System (INIS)

Surzhykov, Andrey; Stohlker, Thomas; Fritzsche, Stephan; Kabachnik, Nikolai M

2009-01-01

Recent theoretical progress in the study of the x-ray characteristic emission from highly-charged, few-electron ions is reviewed. These investigations show that the bound-state radiative transitions in high-Z ions provide a unique tool for better understanding the interplay between the structural and dynamical properties of heavy ions. In order to illustrate such an interplay, detailed calculations are presented for the K α1 decay of the helium-like uranium ions U 90+ following radiative electron capture, Coulomb excitation and dielectronic recombination processes.

Theory and observation of electromagnetic ion cyclotron triggered emissions in the magnetosphere

Science.gov (United States)

Omura, Yoshiharu; Pickett, Jolene; Grison, Benjamin; Santolik, Ondrej; Dandouras, Iannis; Engebretson, Mark; Décréau, Pierrette M. E.; Masson, Arnaud

2010-07-01

We develop a nonlinear wave growth theory of electromagnetic ion cyclotron (EMIC) triggered emissions observed in the inner magnetosphere. We first derive the basic wave equations from Maxwell's equations and the momentum equations for the electrons and ions. We then obtain equations that describe the nonlinear dynamics of resonant protons interacting with an EMIC wave. The frequency sweep rate of the wave plays an important role in forming the resonant current that controls the wave growth. Assuming an optimum condition for the maximum growth rate as an absolute instability at the magnetic equator and a self-sustaining growth condition for the wave propagating from the magnetic equator, we obtain a set of ordinary differential equations that describe the nonlinear evolution of a rising tone emission generated at the magnetic equator. Using the physical parameters inferred from the wave, particle, and magnetic field data measured by the Cluster spacecraft, we determine the dispersion relation for the EMIC waves. Integrating the differential equations numerically, we obtain a solution for the time variation of the amplitude and frequency of a rising tone emission at the equator. Assuming saturation of the wave amplitude, as is found in the observations, we find good agreement between the numerical solutions and the wave spectrum of the EMIC triggered emissions.

Measurements of secondary emissions from plasma arc and laser cutting in standard experiments

International Nuclear Information System (INIS)

Pilot, G.; Noel, J.P.; Leautier, R.; Steiner, H.; Tarroni, G.; Waldie, B.

1992-01-01

As part of an inter-facility comparison of secondary emissions from plasma arc and laser-cutting techniques, standard cutting tests have been done by plasma arc underwater and in air, and by laser beam in air. The same team was commissioned to measure the secondary emissions (solid and gaseous) in each contractor's facility with the same measuring rig. 20 mm and 40 mm thick, grade 304 stainless-steel plates were cut by plasma-torch in three different facilities: Heriot Watt University of Edinburgh, Institut fuer Werkstoffkunde of Universitaet Hannover and CEA/CEN Cadarache. 10 mm and in some cases 20 mm thick, grade 304, stainless-steel plates were cut by laser beam in five different facilities: CEA-CEN Fontenay, CEA-CEN Saclay, Institut fuer Werkstoffkunde of Universitaet Hannover and ENEA/Frascati. The results obtained in the standard experiments are rather similar, and the differences that appear can be explained by the various scales of the involved facilities (semi-industrial and laboratory) and by some particularities in the cutting parameters (an additional secondary gas flow of oxygen in plasma cutting at Universitaet Hannover, for example)

Measurements of secondary emissions from plasma arc and laser cutting in standard experiments

International Nuclear Information System (INIS)

Pilot, G.; Noel, M.; Leautier, R.; Steiner, H.; Tarroni, G.; Waldie, B.

1990-01-01

As part of an inter-facility comparison of secondary emissions from plasma-arc and laser cutting techniques, standard cutting tests have been done by plasma arc underwater and in air and laser beam in air. The same team, CEA/DPT/SPIN, was commissioned to measure the secondary emissions (solid and gaseous) in each contractor's facility with the same measuring rig. 20 mm and 40 mm thick grade 304 stainless steel plates were cut by plasma-torch in three different facilities: Heriot Watt University of Edinburgh, Institute fuer Werkstoffkunde of Hannover and CEA/CEN Cadarache. 10 mm and sometimes 20 mm thick grade 304 stainless steel plates were cut by laser beam in four different facilities: CEA/CEN Fontenay, CEA/CEN Saclay, Institute fuer Werkstoffkunde of Hannover and ENEA/FRASCATI. The results obtained in the standard experiments are rather similar, the differences that appear can be explained by the various scales of the facilities (semi-industrial and laboratory scale) and by some particularity in the cutting parameters (additional secondary gas flow of oxygen in plasma cutting at Hannover for example). Some supplementary experiments show the importance of some cutting parameters. (author)

Lithium-ion battery electrolyte emissions analyzed by coupled thermogravimetric/Fourier-transform infrared spectroscopy

Science.gov (United States)

Bertilsson, Simon; Larsson, Fredrik; Furlani, Maurizio; Albinsson, Ingvar; Mellander, Bengt-Erik

2017-10-01

In the last few years the use of Li-ion batteries has increased rapidly, powering small as well as large applications, from electronic devices to power storage facilities. The Li-ion battery has, however, several safety issues regarding occasional overheating and subsequent thermal runaway. During such episodes, gas emissions from the electrolyte are of special concern because of their toxicity, flammability and the risk for gas explosion. In this work, the emissions from heated typical electrolyte components as well as from commonly used electrolytes are characterized using FT-IR spectroscopy and FT-IR coupled with thermogravimetric (TG) analysis, when heating up to 650 °C. The study includes the solvents EC, PC, DEC, DMC and EA in various single, binary and ternary mixtures with and without the LiPF6 salt, a commercially available electrolyte, (LP71), containing EC, DEC, DMC and LiPF6 as well as extracted electrolyte from a commercial 6.8 Ah Li-ion cell. Upon thermal heating, emissions of organic compounds and of the toxic decomposition products hydrogen fluoride (HF) and phosphoryl fluoride (POF3) were detected. The electrolyte and its components have also been extensively analyzed by means of infrared spectroscopy for identification purposes.

X-ray emission in heavy ion collisions. Final report

International Nuclear Information System (INIS)

Watson, R.L.

1984-01-01

A detailed accounting of the yearly activities of the research program entitled X-ray Emission in Heavy Ion Collisions may be found in the annual progress reports submitted in accordance with the terms of the contract. The principal goals of the program to be summarized herein were (a) to delineate the mechanisms whereby highly ionized atoms in the condensed phase deexcite and return to charge neutrality, (b) to investigate the charge quenching processes acting to reduce the charge states of highly ionized projectiles, and (c) to attain a better understanding of the interactions occurring between highly charged ions and solid surfaces. These projects all relate to problems associated with the ultimate application of controlled thermonuclear reactions as a practical energy source

Limitation of the electron emission in an ion diode with magnetic self-insulation

International Nuclear Information System (INIS)

Pushkarev, A. I.; Isakova, Yu. I.; Guselnikov, V. I.

2011-01-01

The results of a study of the generation of a pulsed ion beam of gigawatt power formed by a diode with an explosive-emission potential electrode in a mode of magnetic self-insulation are presented. The studies were conducted at the TEMP-4M ion accelerator set in double pulse formation mode: the first pulse was negative (300-500 ns and 100-150 kV) and the second, positive (150 ns and 250-300 kV). The ion current density was 20-40 A/cm 2 ; the beam composition was protons and carbon ions. It was shown that plasma is effectively formed over the entire working surface of the graphite potential electrode. During the ion beam generation, a condition of magnetic cutoff of electrons along the entire length of the diode (B/B cr ≥ 4) is fulfilled. Because of the high drift rate, the residence time of the electrons and protons in the anode-cathode gap is 3-5 ns, while for the C + carbon ions, it is more than 8 ns. This denotes low efficiency of magnetic self-insulation in a diode of such a design. At the same time, it has been experimentally observed that, during the generation of ion current (second pulse), the electronic component of the total current is suppressed by a factor of 1.5-2 for a strip diode with plane and focusing geometry. A new model of the effect of limiting the electron emission explaining the decrease in the electronic component of the total current in a diode with magnetic self-insulation is proposed.

Electron emission induced by resonant coherent interaction in ion-surface scattering at grazing incidence

International Nuclear Information System (INIS)

Garcia de Abajo, F.J.; Ponce, V.H.; Echenique, P.M.

1994-01-01

The resonant coherent interaction of an ion with an oriented crystal surface, under grazing-incidence conditions with respect to a special direction of the crystal, gives rise to electron loss to the continuum from electronic bound states of the ion. The calculations presented below predict large probabilities for electron emission due to this mechanism. The electrons are emitted with well defined energies, expressed in terms of the condition of resonance. Furthermore, the emission takes place around certain preferential directions, which are determined by both the latter condition and the symmetry of the surface lattice. Our calculations for MeV He + ions scattered at a W(001) surface along the left-angle 100 right-angle direction with glancing angle of 0--2 mrad indicate a yield of emission close to 1. Using heavier projectiles, one obtains smaller yields, but still large enough to be measurable in some cases (e.g., ∼0.9 for 53 MeV B 4+ and an angle of incidence of 1 mrad). Besides, the initial bound state is energy shifted due to the interaction with both the crystal potential and the velocity-dependent image potential. This results in a slight shift of the peaks of emission, which suggests a possible spectroscopy for analyzing the dynamical interaction of electronic bound states with solid surfaces

Extended calibration range for prompt photon emission in ion beam irradiation

CERN Document Server

Bellini, F.

2014-01-01

Monitoring the dose delivered during proton and carbon ion therapy is still a matter of research. Among the possible solutions, several exploit the measurement of the single photon emission from nuclear decays induced by the irradiation. To fully characterize such emission the detectors need development, since the energy spectrum spans the range above the MeV that is not traditionally used in medical applications. On the other hand, a deeper understanding of the reactions involving gamma production is needed in order to improve the physic models of Monte Carlo codes, relevant for an accurate prediction of the prompt-gamma energy spectrum.This paper describes a calibration technique tailored for the range of energy of interest and reanalyzes the data of the interaction of a 80MeV/u fully stripped carbon ion beam with a Poly-methyl methacrylate target. By adopting the FLUKA simulation with the appropriate calibration and resolution a significant improvement in the agreement between data and simulation is report...

Extended calibration range for prompt photon emission in ion beam irradiation

International Nuclear Information System (INIS)

Bellini, F.; Boehlen, T.T.; Chin, M.P.W.; Collamati, F.; De Lucia, E.; Faccini, R.; Ferrari, A.; Lanza, L.; Mancini-Terracciano, C.; Marafini, M.; Mattei, I.; Morganti, S.; Ortega, P.G.; Patera, V.; Piersanti, L.; Russomando, A.; Sala, P.R.

2014-01-01

Monitoring the dose delivered during proton and carbon ion therapy is still a matter of research. Among the possible solutions, several exploit the measurement of the single photon emission from nuclear decays induced by the irradiation. To fully characterize such emission the detectors need development, since the energy spectrum spans the range above the MeV that is not traditionally used in medical applications. On the other hand, a deeper understanding of the reactions involving gamma production is needed in order to improve the physic models of Monte Carlo codes, relevant for an accurate prediction of the prompt-gamma energy spectrum. This paper describes a calibration technique tailored for the range of energy of interest and reanalyzes the data of the interaction of a 80 MeV/u fully stripped carbon ion beam with a Poly-methyl methacrylate target. By adopting the FLUKA simulation with the appropriate calibration and resolution a significant improvement in the agreement between data and simulation is reported

Extended calibration range for prompt photon emission in ion beam irradiation

Energy Technology Data Exchange (ETDEWEB)

Bellini, F. [Dipartimento di Fisica, Sapienza Università di Roma, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Boehlen, T.T.; Chin, M.P.W. [CERN, Geneva (Switzerland); Collamati, F. [Dipartimento di Fisica, Sapienza Università di Roma, Roma (Italy); INFN Sezione di Roma, Roma (Italy); De Lucia, E. [Laboratori Nazionali di Frascati dell' INFN, Frascati (Italy); Faccini, R., E-mail: riccardo.faccini@roma1.infn.it [Dipartimento di Fisica, Sapienza Università di Roma, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Ferrari, A. [CERN, Geneva (Switzerland); Lanza, L. [Dipartimento di Fisica, Sapienza Università di Roma, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Mancini-Terracciano, C. [CERN, Geneva (Switzerland); Dipartimento di Fisica, Università Roma Tre, Roma (Italy); Marafini, M. [Museo Storico della Fisica e Centro Studi e Ricerche “E. Fermi”, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Mattei, I. [Dipartimento di Fisica, Università Roma Tre, Roma (Italy); Laboratori Nazionali di Frascati dell' INFN, Frascati (Italy); Morganti, S. [INFN Sezione di Roma, Roma (Italy); Ortega, P.G. [CERN, Geneva (Switzerland); Patera, V. [Dipartimento di Scienze di Base e Applicate per Ingegneria, Sapienza Università di Roma, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Piersanti, L. [Dipartimento di Scienze di Base e Applicate per Ingegneria, Sapienza Università di Roma, Roma (Italy); Laboratori Nazionali di Frascati dell' INFN, Frascati (Italy); Russomando, A. [Center for Life Nano Science@Sapienza, Istituto Italiano di Tecnologia, Roma (Italy); INFN Sezione di Roma, Roma (Italy); Sala, P.R. [INFN Sezione di Milano, Milano (Italy); and others

2014-05-01

Monitoring the dose delivered during proton and carbon ion therapy is still a matter of research. Among the possible solutions, several exploit the measurement of the single photon emission from nuclear decays induced by the irradiation. To fully characterize such emission the detectors need development, since the energy spectrum spans the range above the MeV that is not traditionally used in medical applications. On the other hand, a deeper understanding of the reactions involving gamma production is needed in order to improve the physic models of Monte Carlo codes, relevant for an accurate prediction of the prompt-gamma energy spectrum. This paper describes a calibration technique tailored for the range of energy of interest and reanalyzes the data of the interaction of a 80 MeV/u fully stripped carbon ion beam with a Poly-methyl methacrylate target. By adopting the FLUKA simulation with the appropriate calibration and resolution a significant improvement in the agreement between data and simulation is reported.

Ion cyclotron emission due to collective instability of fusion products and beam ions in TFTR and JET

International Nuclear Information System (INIS)

Dendy, R.O.; Clements, K.G.; Lashmore-Davies, C.N.; Cottrell, G.A.; Majeski, R.; Cauffman, S.

1995-06-01

Ion cyclotron emission (ICE) has been observed from neutral beam-heated TFTR and JET tritium experiments at sequential cyclotron harmonics of both fusion products and beam ions. The emission originates from the outer mid-plane plasma, where fusion products and beam ions are likely to have a drifting ring-type velocity-space distribution which is anisotropic and sharply peaked. Fusion product-driven ICE in both TFTR and JET can be attributed to the magnetoacoustic cyclotron instability, which involves the excitation of obliquely propagating waves on the fast Alfven/ion Bernstein branch at cyclotron harmonics of the fusion products. Differences between ICE observations in JET and TFTR appear to reflect the sensitivity of the instability growth rate to the ratio υ birth /c A , where υ birth is the fusion product birth speed and c A is the local Alfven speed:for fusion products in the outer midplane edge of TFTR, υ birth A ; for alpha-particles in the outer midplane edge of JET, the opposite inequality applies. If sub-Alfvenic fusion products are isotropic or have undergone even a moderate degree of thermalization, the magnetoacoustic instability cannot occur. In contrast, the super-Alfvenic alpha-particles which are present in the outer mid-plane of JET can drive the magnetoacoustic cyclotron instability even if they are isotropic or have a relatively broad distribution of speeds. These conclusions may account for the observation that fusion product-driven ICE in JET persists for longer than fusion product-driven ICE in TFTR. (Author)

Secondary Emission From Synthetic Opal Infiltrated by Colloidal Gold and Glycine

International Nuclear Information System (INIS)

Dovbeshko, G.I.; Fesenko, O.M.; Boyko, V.V.; Romanyuk, V.R.; Gorelik, V.S.; Moiseyenko, V.N.; Sobolev, V.B.; Shvalagin, V.V.

2012-01-01

A comparison of the secondary emission (photoluminescence) and Bragg reflection spectra of photonic crystals (PC), namely, synthetic opals, opals infiltrated by colloidal gold, glycine, and a complex of colloidal gold with glycine is performed. The infiltration of colloidal gold and a complex of colloidal gold with glycine into the pores of PC causes a short-wavelength shift (about 5-15 nm) of the Bragg reflection and increases the intensity of this band by 1.5-3 times. In photoluminescence, the infiltration of PC by colloidal gold and colloidal gold with glycine suppresses the PC emission band near 375-450 nm and enhances the shoulder of the stop-zone band of PC in the region of 470-510 nm. The shape of the observed PC emission band connected with defects in synthetic opal is determined by the type of infiltrates and the excitation wavelength. Possible mechanisms of the effects are discussed.

Time-resolved analysis of primary volatile emissions and secondary aerosol formation potential from a small-scale pellet boiler

Science.gov (United States)

Czech, Hendryk; Pieber, Simone M.; Tiitta, Petri; Sippula, Olli; Kortelainen, Miika; Lamberg, Heikki; Grigonyte, Julija; Streibel, Thorsten; Prévôt, André S. H.; Jokiniemi, Jorma; Zimmermann, Ralf

2017-06-01

Small-scale pellet boilers and stoves became popular as a wood combustion appliance for domestic heating in Europe, North America and Asia due to economic and environmental aspects. Therefore, an increasing contribution of pellet boilers to air pollution is expected despite their general high combustion efficiency. As emissions of primary organic aerosol (POA) and permanent gases of pellet boilers are well investigated, the scope of this study was to investigate the volatile organic emissions and the formation potential of secondary aerosols for this type of appliance. Fresh and aged emissions were analysed by a soot-particle aerosol time-of-flight mass spectrometry (SP-AMS) and the molecular composition of the volatile precursors with single-photon ionisation time-of-flight mass spectrometry (SPI-TOFMS) at different pellet boiler operation conditions. Organic emissions in the gas phase were dominated by unsaturated hydrocarbons while wood-specific VOCs, e.g. phenolic species or substituted furans, were only detected during the starting phase. Furthermore, organic emissions in the gas phase were found to correlate with fuel grade and combustion technology in terms of secondary air supply. Secondary organic aerosols of optimised pellet boiler conditions (OPT, state-of-the-art combustion appliance) and reduced secondary air supply (RSA, used as a proxy for pellet boilers of older type) were studied by simulating atmospheric ageing in a Potential Aerosol Mass (PAM) flow reactor. Different increases in OA mass (55% for OPT, 102% for RSA), associated with higher average carbon oxidation state and O:C, could be observed in a PAM chamber experiment. Finally, it was found that derived SOA yields and emission factors were distinctly lower than reported for log wood stoves.

Single ion hit detection set-up for the Zagreb ion microprobe

Science.gov (United States)

Smith, R. W.; Karlušić, M.; Jakšić, M.

2012-04-01

Irradiation of materials by heavy ions accelerated in MV tandem accelerators may lead to the production of latent ion tracks in many insulators and semiconductors. If irradiation is performed in a high resolution microprobe facility, ion tracks can be ordered by submicrometer positioning precision. However, full control of the ion track positioning can only be achieved by a reliable ion hit detection system that should provide a trigger signal irrespectively of the type and thickness of the material being irradiated. The most useful process that can be utilised for this purpose is emission of secondary electrons from the sample surface that follows the ion impact. The status report of the set-up presented here is based on the use of a channel electron multiplier (CEM) detector mounted on an interchangable sample holder that is inserted into the chamber in a close geometry along with the sample to be irradiated. The set-up has been tested at the Zagreb ion microprobe for different ions and energies, as well as different geometrical arrangements. For energies of heavy ions below 1 MeV/amu, results show that efficient (100%) control of ion impact can be achieved only for ions heavier than silicon. The successful use of the set-up is demonstrated by production of ordered single ion tracks in a polycarbonate film and by monitoring fluence during ion microbeam patterning of Foturan glass.

Analysis of trace elements by means of accelerator secondary ion mass spectrometry

International Nuclear Information System (INIS)

Ender, R.M.

1997-01-01

The analysis of material composition and trace element concentration is of increasing interest primarily in semiconductor technology but also in metallurgy, geology, biology and medicine. At present, Secondary Ion Mass Spectrometry (SIMS) is in many respects the best technique to provide 3-dimensional information on the distribution of trace elements with concentrations below 1 ppm. However, due to the presence of molecular ions the detectability of many trace elements it restricted because of molecular mass interferences. In addition, detectors used in SIMS have a background counting rate of 0.1-1 Hz, which further limits trace element analysis. In Accelerator Mass Spectrometry (AMS) long-lived radionuclides are detected free of molecular interferences and detector background at isotopic ratios as low as 10 -15 . Moreover, isobaric interferences can be reduced as well. In order to benefit from these advantages a combination of SIMS and AMS (Accelerator SIMS) has been proposed almost 20 years ago, but no facility has ever been fully developed. It has been the aim of this work to add a new sputtering chamber for AMS measurements of ultrapure semiconductor material to the existing PSI/ETH AMS facility. To fulfill the requirements of material analysis, an UHV chamber with special precautions against contamination has been built and adapted to the existing AMS setup. For sputtering, a commercial Cs gun with an ExB filter and a 1 o beam bend for neutral particle suppression is used to obtain a pure Cs ion beam. The gun is equipped with different apertures for varying the diameter of the beam spot. With the integrated scanning unit the 10 keV Cs beam can be rastered over approximately 1 mm 2 . This allows different applications such as bulk analysis, depth profiling and imaging. The secondary ion extraction is matched to the ion optical and geometrical requirements of the existing accelerator mass spectrometer. (author) figs., tabs., 67 refs

Effect of Cs and Li atom adsorption on MgO: Secondary emission and work function

International Nuclear Information System (INIS)

Bagraev, N.T.; Borisov, V.L.

1980-01-01

Adsorption of Cs and Li atoms on the surface of single crystal magnesium oxide films has been investigated using Auger, LEED and contact difference techniques. A decreased work function for a single crystal MgO film grown on the Mo (100) face was observed to be accompanied by an increased secondary electron emission yield shown to be due to a larger escape depth for secondary electrons. LEED showed well ordered layers of adsorbed Cs on the MgO film surface. A model to explain the behaviour of Cs atoms on the film surface is proposed. It is shown that the stability of the Cs coating is not dependent on a prolonged bombardment of the film by incident electron beams of high current density. Depositing and implanting of thin single crystal MgO films with Li were found to result in an increased secondary electron emission yield, with Li adsorption on the MgO film surface being disordered. (orig.)

High mass accuracy and high mass resolving power FT-ICR secondary ion mass spectrometry for biological tissue imaging

NARCIS (Netherlands)

Smith, D.F.; Kiss, A.; Leach, F.E.; Robinson, E.W.; Paša-Tolić, L.; Heeren, R.M.A.

2013-01-01

Biological tissue imaging by secondary ion mass spectrometry has seen rapid development with the commercial availability of polyatomic primary ion sources. Endogenous lipids and other small bio-molecules can now be routinely mapped on the sub-micrometer scale. Such experiments are typically

Modelling ion cyclotron emission from KSTAR tokamak and LHD helical device plasmas

Science.gov (United States)

Dendy, Richard; Chapman, Ben; Reman, Bernard; Chapman, Sandra; Akiyama, Tsuyoshi; Yun, Gunsu

2017-10-01

New high quality measurements of ion cyclotron emission (ICE) from KSTAR and LHD greatly extend the scope and diversity of plasma conditions under which ICE is observed. Variables include the origin (fusion reactions or neutral beam injection) and energy (sub- or super-Alfvénic) of the minority energetic ions that drive ICE; the composition of the bulk plasma (hydrogen or deuterium) which supports the modes excited; plasma density in the emitting region, and the timescale on which it changes; and toroidal magnetic field geometry (tokamak or helical device). Future exploitation of ICE as a diagnostic for energetic ion populations in JET D-T plasmas and in ITER rests on quantitative understanding of the physics of the emission. This is tested and extended by current KSTAR and LHD measurements of ICE. We report progress on direct numerical simulation using full orbit ion kinetic codes that solve the Maxwell-Lorentz equations for hundreds of millions of particles. In the saturated regime, these simulations yield excited field spectra that correspond directly to the measured ICE spectra under diverse KSTAR and LHD regimes. At early times, comparison of simulation outputs with linear analytical theory confirms the magnetoacoustic cyclotron instability as the basic driver of ICE. Supported by RCUK Energy Programme Grant EP/P012450/1, NRF Korea Grant 2014M1A7A1A03029881, NIFS budget ULHH029 and Euratom.

[Emission Characteristics of Water-Soluble Ions in Fumes of Coal Fired Boilers in Beijing].

Science.gov (United States)

Hu, Yue-qi; Ma, Zhao-hui; Feng, Ya-jun; Wang, Chen; Chen, Yuan-yuan; He, Ming

2015-06-01

Selecting coal fired boilers with typical flue gas desulfurization and dust extraction systems in Beijing as the study objects, the issues and characteristics of the water-soluble ions in fumes of coal fired boilers and theirs influence factors were analyzed and evaluated. The maximum mass concentration of total water-soluble ions in fumes of coal fired boilers in Beijing was 51.240 mg x m(-3) in the benchmark fume oxygen content, the minimum was 7.186 mg x m(-3), and the issues of the water-soluble ions were uncorrelated with the fume moisture content. SO4(2-) was the primary characteristic water-soluble ion for desulfurization reaction, and the rate of contribution of SO4(2-) in total water-soluble ions ranged from 63.8% to 81.0%. F- was another characteristic water-soluble ion in fumes of thermal power plant, and the rate of contribution of F- in total water-soluble ions ranged from 22.2% to 32.5%. The fume purification technologies significantly influenced the issues and the emission characteristics of water-soluble ions in fumes of coal fired boilers. Na+ was a characteristic water-soluble ion for the desulfurizer NaOH, NH4+ and NO3+ were characteristic for the desulfurizer NH4HCO3, and Mg2+ was characteristic for the desulfurizer MgO, but the Ca2+ emission was not increased by addition of the desulfurizer CaO or CaCO3 The concentrations of NH4+ and NO3- in fumes of thermal power plant were lower than those in fumes of industrial or heating coal fired boilers. The form of water-soluble ions was significantly correlated with fume temperature. The most water-soluble ions were in superfine state at higher fume temperature and were not easily captured by the filter membrane.

Scaling of x-ray emission and ion velocity in laser produced Cu ...

Indian Academy of Sciences (India)

Laser plasma; x-ray emission; conversion efficiency; ion velocities. ... fits from this kind of optimization studies are in the fields of x-ray lithography, x-ray lasers etc. .... formula between the x-ray conversion rate versus different parameters of the ...

A high brightness source for nano-probe secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Smith, N.S. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)], E-mail: n.smith@oregon-physics.com; Tesch, P.P.; Martin, N.P.; Kinion, D.E. [Oregon Physics LLC, 2704 SE 39th Loop, Suite 109, Hillsboro, OR 97123 (United States)

2008-12-15

The two most prevalent ion source technologies in the field of surface analysis and surface machining are the Duoplasmatron and the liquid metal ion source (LMIS). There have been many efforts in this area of research to develop an alternative source [; N.S. Smith, W.P. Skoczylas, S.M. Kellogg, D.E. Kinion, P.P. Tesch, O. Sutherland, A. Aanesland, R.W. Boswell, J. Vac. Sci. Technol. B 24 (6) (2006) 2902-2906] with the brightness of a LMIS and yet the ability to produce secondary ion yield enhancing species such as oxygen. However, to date a viable alternative has not been realized. The high brightness and small virtual source size of the LMIS are advantageous for forming high resolution probes but a significant disadvantage when beam currents in excess of 100 nA are required, due to the effects of spherical aberration from the optical column. At these higher currents a source with a high angular intensity is optimal and in fact the relatively moderate brightness of today's plasma ion sources prevail in this operating regime. Both the LMIS and Duoplasmatron suffer from a large axial energy spread resulting in further limitations when forming focused beams at the chromatic limit where the figure-of-merit is inversely proportional to the square of the energy spread. Also, both of these ion sources operate with a very limited range of ion species. This article reviews some of the latest developments and some future potential in this area of instrument development. Here we present an approach to source development that could lead to oxygen ion beam SIMS imaging with 10 nm resolution, using a 'broad area' RF gas phase ion source.

Measuring the radial density distribution of light emission around the track of fast ions in nitrogen

International Nuclear Information System (INIS)

Ibach, T.

1983-01-01

For analysing the emission and stopping of ionization electrons (σ-electrons) emitted by fast ions passing through a gas, the radial density distribution of the light emission of the (0,0) transition of two optical bands in nitrogen have been measured. The systems selected for the epxeriments are the 2nd positive system (2.PS) at 337.1 nm primarily excited by low-energy electrons of about 20 eV, and the first negative system (1.NS) at 391.4 nm excited by faster electrons and simultaneous ionization. The equipment developed for the experiments records the light emission with a telescope-type optical arrangement including interference filters, allowing high local resolution and dynamics of the measured range. The measurements have been carried out at pressures between 0.133 and 13.3 mbar, using photons of energies ranging from 270 keV to 2.8 MeV, helium 3 beams of 270 keV/u and 500 keV/u, and neon beams of 270 keV/u. Abel's inversion applied to the distance functions allows calculation of the spatial light emission density which is normalized for a gas density of 1 g/cm 3 . The profiles of the two bands indicate that the σ-electron spectrum gets harder in outward direction. Next to the beam the impact density decreases faster with increasing ion energy than the stopping power (increasing interaction range of the σ-electrons). With photon beams, about half of the whole light emission in the 1. NS, and of the ionization, is induced by primary interactions of the ion beam. This proportion decreases at constant energy per nucleon with increasing atomic number of the ions as compared with the σ-electrons. The primary σ-emission gets harder with higher atomic numbers. (orig./HP) [de

Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment

International Nuclear Information System (INIS)

Stevie, F.A.; Kahora, P.M.; Simons, D.S.; Chi, P.

1988-01-01

Changes in secondary ion yields of matrix and dopant species have been correlated with changes in surface topography during O + 2 bombardment of Si and GaAs. In Si, profiles were measured in (100) wafers at 6- and 8-keV impact energy. At 6 keV, a yield increase of about 70% occurred for Si + over a depth range of 2.5 to 3.5 μm, with changes in other species ranging from a decrease of ∼20% for Si + 3 to an increase of more than 25% for O + . The development of a rippled surface topography was observed in scanning electron micrographs over the same depth range. Similar effects occurred over a 3--5 μm depth range for 8-keV ions, and in (111) silicon at a depth of 3 to 4 μm for 6-keV ions. No differences were noted between p- and n-type silicon, or implanted and unimplanted silicon. In GaAs, profiles were measured in (100) wafers at 2.5-, 5.5-, and 8-keV impact energies. At 8 keV, a yield increase of about 70% was found for GaO + in the range 0.6--1.0 μm, with smaller changes for other matrix species. At 5.5 keV, similar effects were observed, but over a depth interval of 0.3 to 0.7 μm. No yield changes were detected at 2.5-keV impact energy. The yield changes at the higher energies were again correlated with the onset of changes in topography. No change in ion yield or surface topography was noted for Cs + bombardment of Si or GaAs. The topography and ion yield changes are affected by the angle of incidence and, for Si, the oxygen coverage. The results show that the practice of normalizing secondary ion mass spectrometry dopant profiles to a matrix signal must be modified for situations where matrix yield changes occur

Electronic emission and electron guns

International Nuclear Information System (INIS)

Roy, Amitava

2010-01-01

This paper reviews the process of electron emission from metal surface. Although electrons move freely in conductors like metals, they normally do not leave the metal without some manipulation. In fact, heating and bombardment are the two primary ways in which electrons are emitted through the use of a heating element behind the cathode (termed thermionic emission) or as a result of bombardment with a beam of electrons, ions, or metastable atoms (termed secondary emission). Another important emission mechanism called Explosive Electron Emission (EEE) is also often used in various High Voltage Pulse Power Systems to generate very high current (few hundreds of kA) pulsed electron beams. The electron gun is the device in that it shoots off a continuous (or pulsed) stream of electrons. A brief idea about the evolution of the electron gun components and their basis of functioning are also discussed. (author)

Aggregation-induced emission active tetraphenylethene-based sensor for uranyl ion detection

Energy Technology Data Exchange (ETDEWEB)

Wen, Jun; Huang, Zeng; Hu, Sheng [Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang, 621900, Sichuan Province (China); Li, Shuo, E-mail: lishuo@cqut.edu.cn [School of Chemical Engineering, Chongqing University of Technology, Chongqing 400054 (China); Li, Weiyi, E-mail: weiyili@mail.xhu.edu.cn [School of Science, Xihua University, Chengdu, Sichuan, 610065 (China); Wang, Xiaolin, E-mail: xlwang@caep.cn [Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang, 621900, Sichuan Province (China)

2016-11-15

Highlights: • A novel AIE fluorescent sensor for the detection of uranyl has been developed. • TPE-T is capable of visually distinguish UO{sub 2}{sup 2+} among many metals owing to the AIE phenomenon. • TPE-T showed a wide effective pH range, high selectivity and good anti-interference qualities. • TPE-T showed good accuracy in the determination of uranyl in river water. - Abstract: A novel tetraphenylethene-based fluorescent sensor, TPE-T, was developed for the detection of uranyl ions. The selective binding of TPE-T to uranyl ions resulted in a detectable signal owing to the quenching of its aggregation-induced emission. The developed sensor could be used to visually distinguish UO{sub 2}{sup 2+} from lanthanides, transition metals, and alkali metals under UV light; the presence of other metal ions did not interfere with the detection of uranyl ions. In addition, TPE-T was successfully used for the detection of uranyl ions in river water, illustrating its potential applications in environmental systems.

Quantum molecular dynamics study on energy transfer to the secondary electron in surface collision process of an ion

International Nuclear Information System (INIS)

Shibahara, M; Satake, S; Taniguchi, J

2008-01-01

In the present study the quantum molecular dynamics method was applied to an energy transfer problem to an electron during ionic surface collision process in order to elucidate how energy of ionic collision transfers to the emitted electrons. Effects of various physical parameters, such as the collision velocity and interaction strength between the observed electron and the classical particles on the energy transfer to the electron were investigated by the quantum molecular dynamics method when the potassium ion was collided with the surface so as to elucidate the energy path to the electron and the predominant factor of energy transfer to the electron. Effects of potential energy between the ion and the electron and that between the surface molecule and the electron on the electronic energy transfer were shown in the present paper. The energy transfer to the observed secondary electron through the potential energy term between the ion and the electron was much dependent on the ion collision energy although the energy increase to the observed secondary electron was not monotonous through the potential energy between the ion and surface molecules with the change of the ion collision energy

Application of secondary ions mass spectrometry (SIMS) in studies of internal contamination

International Nuclear Information System (INIS)

Amaral, Ademir; Galle, Pierre; Colas-Linhart, Nicole

2000-01-01

Secondary Ion Mass Spectrometry (SIMS) permits the detection of stable and radioactive nuclides. Based on the ablation of specimens by ion bombardment this mass spectrometry method allows a rapid assessment of trace elements in biological samples. Its resolving mass power provides an efficient analytical method and, in particular, it makes possible accurate isotopic ratio determination. In this work, the application of SIMS has been investigated in studies of internal contamination. In vivo studies were carried out using duodenal tissue sections from rats contaminated with cerium. Tests were performed to localize this element as a result of the contamination. In this report, analytical procedures and the potential of SIMS in biological research are presented and discussed. (author)

Ultrasensitive probing of the protein resistance of PEG surfaces by secondary ion mass spectrometry

DEFF Research Database (Denmark)

Kingshott, P.; McArthur, S.; Thissen, H.

2002-01-01

The highly sensitive surface analytical techniques X-ray photoelectron spectroscopy (XPS) and time-of-flight static secondary ion mass spectrometry (ToF-SIMS) were used to test the resistance of poly(ethylene glycol) (PEG) coatings towards adsorption of lysozyme (LYS) and fibronectin (FN). PEG co...

Radioactive heavy ion secondary beams

International Nuclear Information System (INIS)

Bimbot, R.

1987-01-01

The production of secondary radioactive beams at GANIL using the LISE spectrometer is reviewed. The experimental devices, and secondary beam characteristics are summarized. Production of neutron rich secondary beams was studied for the systems Ar40 + Be at 44 MeV/u, and 018 + Be at 45 and 65 MeV/u. Partial results were also obtained for the system Ne22 + Ta at 45 MeV/u. Experiments using secondary beams are classified into two categories: those which correspond to fast transfer of nuclei from the production target to a well shielded observation point; and those in which the radioactive beam interacts with a secondary target

Feasibility of carbon-ion radiotherapy for re-irradiation of locoregionally recurrent, metastatic, or secondary lung tumors.

Science.gov (United States)

Hayashi, Kazuhiko; Yamamoto, Naoyoshi; Karube, Masataka; Nakajima, Mio; Tsuji, Hiroshi; Ogawa, Kazuhiko; Kamada, Tadashi

2018-03-02

Intrathoracic recurrence after carbon-ion radiotherapy for primary or metastatic lung tumors remains a major cause of cancer-related deaths. However, treatment options are limited. Herein, we report on the toxicity and efficacy of re-irradiation with carbon-ion radiotherapy for locoregionally recurrent, metastatic, or secondary lung tumors. Data of 95 patients with prior intrathoracic carbon-ion radiotherapy who were treated with re-irradiation with carbon-ion radiotherapy at our institution between 2006 and 2016 were retrospectively analyzed. Seventy-three patients (76.8%) had primary lung tumors and 22 patients (23.2%) had metastatic lung tumors. The median dose of initial carbon-ion radiotherapy was 52.8 Gy (relative biological effectiveness) and the median dose of re-irradiation was 66.0 Gy (relative biological effectiveness). None of the patients received concurrent chemotherapy. The median follow-up period after re-irradiation was 18 months. In terms of grade ≥3 toxicities, one patient experienced each of the following: grade 5 bronchopleural fistula, grade 4 radiation pneumonitis, grade 3 chest pain, and grade 3 radiation pneumonitis. The 2-year local control and overall survival rates were 54.0% and 61.9%, respectively. In conclusion, re-irradiation with carbon-ion radiotherapy was associated with relatively low toxicity and moderate efficacy. Re-irradiation with carbon-ion radiotherapy might be an effective treatment option for patients with locoregionally recurrent, metastatic, or secondary lung tumors. © 2018 The Authors. Cancer Science published by John Wiley & Sons Australia, Ltd on behalf of Japanese Cancer Association.

Cradle-to-Gate Emissions from a Commercial Electric Vehicle Li-Ion Battery: A Comparative Analysis.

Science.gov (United States)

Kim, Hyung Chul; Wallington, Timothy J; Arsenault, Renata; Bae, Chulheung; Ahn, Suckwon; Lee, Jaeran

2016-07-19

We report the first cradle-to-gate emissions assessment for a mass-produced battery in a commercial battery electric vehicle (BEV); the lithium-ion battery pack used in the Ford Focus BEV. The assessment was based on the bill of materials and primary data from the battery industry, that is, energy and materials input data from the battery cell and pack supplier. Cradle-to-gate greenhouse gas (GHG) emissions for the 24 kWh Ford Focus lithium-ion battery are 3.4 metric tonnes of CO2-eq (140 kg CO2-eq per kWh or 11 kg CO2-eq per kg of battery). Cell manufacturing is the key contributor accounting for 45% of the GHG emissions. We review published studies of GHG emissions associated with battery production to compare and contrast with our results. Extending the system boundary to include the entire vehicle we estimate a 39% increase in the cradle-to-gate GHG emissions of the Focus BEV compared to the Focus internal combustion engine vehicle (ICEV), which falls within the range of literature estimates of 27-63% increases for hypothetical nonproduction BEVs. Our results reduce the uncertainties associated with assessment of BEV battery production, serve to identify opportunities to reduce emissions, and confirm previous assessments that BEVs have great potential to reduce GHG emissions over the full life cycle and provide local emission free mobility.

Kinetic electron emission from metal surfaces induced by impact of slow ions

Czech Academy of Sciences Publication Activity Database

Šroubek, Zdeněk; Lorinčík, Jan

-, č. 625 (2014), s. 7-9 ISSN 0039-6028 R&D Projects: GA MŠk(CZ) ME10086 Institutional support: RVO:67985882 Keywords : Ion induced kinetic electron emission * Electronic excitation Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.925, year: 2014

Electrochemical lithiation of silicon electrodes. Neutron reflectometry and secondary ion mass spectrometry investigations

Energy Technology Data Exchange (ETDEWEB)

Jerliu, Bujar; Doerrer, Lars; Hueger, Erwin [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Seidlhofer, Beatrix-Kamelia; Steitz, Roland [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH, Berlin (Germany); Borchardt, Guenter; Schmidt, Harald [Technische Univ. Clausthal, Clausthal-Zellerfeld (Germany). AG Mikrokinetik; Clausthaler Zentrum fuer Materialtechnik (CZM), Clausthal-Zellerfeld (Germany)

2017-11-15

In-situ neutron reflectometry and ex-situ secondary ion mass spectrometry in combination with electrochemical methods were used to study the lithiation of amorphous silicon electrodes. For that purpose specially designed closed three-electrode electrochemical cells with thin silicon films as the working electrode and lithium as counter and reference electrodes were used. The neutron reflectometry results obtained in-situ during galvanostatic cycling show that the incorporation, redistribution and removal of Li in amorphous silicon during a lithiation cycle can be monitored. It was possible to measure the volume modification during lithiation, which is found to be rather independent of cycle number, current density and film thickness and in good agreement with first-principles calculations as given in literature. Indications for an inhomogeneous lithiation mechanism were found by secondary ion mass spectrometry measurements. Lithium tracer diffusion experiments indicate that the diffusivities inside the lithiated region (D > 10{sup -15} m{sup 2} s{sup -1}) are considerably higher than in pure amorphous silicon as known from literature. This suggests a kinetics based explanation for the occurrence of an inhomogeneous lithiation mechanism.

Electrom emission from slow highly charged ions interacting with a metal surface

International Nuclear Information System (INIS)

Aumayr, F.; Kurz, H.; Toeglhofer, K.; Winter, H.

1992-01-01

Recent progress in investigating electron emission from slow highly charged ions approaching a metal surface is discussed. In particular, new informations on generation and decay of transient multiply excited ''hollow atoms'' developing during these processes have been gained from measurement of the statistics of emitted electrons (ES). ES and precise total electron yields derived from the former have been measured for normal incidence of slow (impact velocity 1/15.10 4 ms -1 ) multicharged ions N q+ (q≤6), Ne q+ (q≤10), Ar q+ (q≤16), Kr q+ (q≤10), Xe q+ (q≤10) and I q+ (q≤25) on clean polycrystalline gold. A classical over-barrier approach as recently introduced by Burgdoerfer et al. 1991 has been extended and successfully applied to model the measured impact-velocity dependences of total electron yields. In this way contributions from different electron emission mechanisms could be identified. (orig.)

Transient effects in SIMS analysis of Si with Cs sup + at high incidence angles Secondary ion yield variations

CERN Document Server

Heide, P A W

2002-01-01

Secondary ion mass spectrometry (SIMS) depth profile analysis of Si wafers using 1 keV Cs sup + primary ions at large incidence angles (80 deg. ) is plagued by unusually strong transient effects (variations in both sputter and ion yields). Analysis of a native oxide terminated Si wafer with and without the aid of an O sub 2 leak, and an Ar sup + pre-sputtered wafer revealed correlations between the implanted Cs content and various secondary ion intensities consistent with that expected from a resonance charge transfer process (that assumed by the electron tunneling model). Cs concentrations were defined through X-ray photoelectron spectroscopy of the sputtered surface from SIMS profiles terminated within the transient region. These scaled with the surface roughening occurring under these conditions and can be explained as resulting from the associated drop in sputter rates. An O induced transient effect from the native oxide was also identified. Characterization of these effects allowed the reconstruction of ...

Ion emission from laser-produced plasmas with two electron temperatures

International Nuclear Information System (INIS)

Wickens, L.M.; Allen, J.E.; Rumsby, P.T.

1978-01-01

An analytic theory for the expansion of a laser-produced plasma with two electron temperatures is presented. It is shown that from the ion-emission velocity spectrum such relevant parameters as the hot- to -cold-electron density ratio, the absolute hot- and cold-electron temperatures, and a sensitive measure of hot- and cold-electron temperature ratio can be deduced. A comparison with experimental results is presented

Effects of uranium bombardment by 20-40 KeV argon ions, Annex 2

International Nuclear Information System (INIS)

Nenadovic, T.; Jurela, Z.

1966-01-01

This paper shows the results of argon ions interaction with the polycrystal natural uranium. Thin foil of uranium about 200 μ was bombarded by 20-40 KeV argon ions. Coefficients of cathode scattering δ and secondary electrons emission γ were measured, during the process A + →U. The foil was then studied by transmission method and method of single step replica using an electron microscope [sr

Relativistic quantum dynamics in strong fields: Photon emission from heavy, few-electron ions

International Nuclear Information System (INIS)

Fritzsche, S.; Stoehlker, T.

2005-03-01

Recent progress in the study of the photon emission from highly-charged heavy ions is reviewed. These investigations show that high-Z ions provide a unique tool for improving the understanding of the electron-electron and electron-photon interaction in the presence of strong fields. Apart from the bound-state transitions, which are accurately described in the framework of quantum electrodynamics, much information has been obtained also from the radiative capture of (quasi-) free electrons by high-Z ions. Many features in the observed spectra hereby confirm the inherently relativistic behavior of even the simplest compound quantum systems in nature. (orig.)

Detection of formaldehyde emissions from an industrial zone in the Yangtze River Delta region of China using a proton transfer reaction ion-drift chemical ionization mass spectrometer

Science.gov (United States)

Ma, Yan; Diao, Yiwei; Zhang, Bingjie; Wang, Weiwei; Ren, Xinrong; Yang, Dongsen; Wang, Ming; Shi, Xiaowen; Zheng, Jun

2016-12-01

A proton transfer reaction ion-drift chemical ionization mass spectrometer (PTR-ID-CIMS) equipped with a hydronium (H3+O) ion source was developed and deployed near an industrial zone in the Yangtze River Delta (YRD) region of China in spring 2015 to investigate industry-related emissions of volatile organic compounds (VOCs). Air pollutants including formaldehyde (HCHO), aromatics, and other trace gases (O3 and CO) were simultaneously measured. Humidity effects on the sensitivity of the PTR-ID-CIMS for HCHO detection were investigated and quantified. The performances of the PTR-ID-CIMS were also validated by intercomparing with offline HCHO measurement technique using 2,4-dinitrophenylhydrazone (DNPH) cartridges and the results showed fairly good agreement (slope = 0.81, R2 = 0.80). The PTR-ID-CIMS detection limit of HCHO (10 s, three-duty-cycle averages) was determined to be 0.9-2.4 (RH = 1-81.5 %) parts per billion by volume (ppbv) based on 3 times the standard deviations of the background signals. During the field study, observed HCHO concentrations ranged between 1.8 and 12.8 ppbv with a campaign average of 4.1 ± 1.6 ppbv, which was comparable with previous HCHO observations in other similar locations of China. However, HCHO diurnal profiles showed few features of secondary formation. In addition, time series of both HCHO and aromatic VOCs indicated strong influence from local emissions. Using a multiple linear regression fit model, on average the observed HCHO can be attributed to secondary formation (13.8 %), background level (27.0 %), and industry-related emissions, i.e., combustion sources (43.2 %) and chemical productions (16.0 %). Moreover, within the plumes the industry-related emissions can account for up to 69.2 % of the observed HCHO. This work has provided direct evidence of strong primary emissions of HCHO from industry-related activities. These primary HCHO sources can potentially have a strong impact on local and regional air pollution formation

Secondary organic aerosol formation from road vehicle emissions

Science.gov (United States)

Pieber, Simone M.; Platt, Stephen M.; El Haddad, Imad; Zardini, Alessandro A.; Suarez-Bertoa, Ricardo; Slowik, Jay G.; Huang, Ru-Jin; Hellebust, Stig; Temime-Roussel, Brice; Marchand, Nicolas; Drinovec, Luca; Mocnik, Grisa; Baltensperger, Urs; Astorga, Covadogna; Prévôt, André S. H.

2014-05-01

Organic aerosol particles (OA) are a major fraction of the submicron particulate matter. OA consists of directly emitted primary (POA) and secondary OA (SOA). SOA is formed in-situ in the atmosphere via the reaction of volatile organic precursors. The partitioning of SOA species depends not only on the exposure to oxidants, but for instance also on temperature, relative humidity (RH), and the absorptive mass chemical composition (presence of inorganics) and concentration. Vehicle exhaust is a known source of POA and likely contributes to SOA formation in urban areas [1;2]. This has recently been estimated by (i) analyzing ambient data from urban areas combined with fuel consumption data [3], (ii) by examining the chemical composition of raw fuels [4], or (iii) smog chamber studies [5, 6]. Contradictory and thus somewhat controversial results in the relative quantity of SOA from diesel vs. gasoline vehicle exhaust were observed. In order to elucidate the impact of variable ambient conditions on the potential SOA formation of vehicle exhaust, and its relation to the emitted gas phase species, we studied SOA formed from the exhaust of passenger cars and trucks as a function of fuel and engine type (gasoline, diesel) at different temperatures (T 22 vs. -7oC) and RH (40 vs. 90%), as well as with different levels of inorganic salt concentrations. The exhaust was sampled at the tailpipe during regulatory driving cycles on chassis dynamometers, diluted (200 - 400x) and introduced into the PSI mobile smog chamber [6], where the emissions were subjected to simulated atmospheric ageing. Particle phase instruments (HR-ToF-AMS, aethalometers, CPC, SMPS) and gas phase instruments (PTR-TOF-MS, CO, CO2, CH4, THC, NH3 and other gases) were used online during the experiments. We found that gasoline emissions, because of cold starts, were generally larger than diesel, especially during cold temperatures driving cycles. Gasoline vehicles also showed the highest SOA formation

Secondary electron emission from a thin carbon foil induced by H+, He2+ and Li3+ at fixed velocity of 1 MeV/u

International Nuclear Information System (INIS)

Ogawa, H.; Sorai, K.; Amano, S.; Ishii, K.; Kaneko, T.

2013-01-01

The statistical distributions of the number of forward- and backward-emitted secondary electrons (SE’s) from a thin carbon foil have been measured simultaneously in coincidence with foil-transmitted H + , He 2+ and Li 3+ ions of 1 MeV/u in order to examine the forward–backward correlation of the SE emission (refer to as ‘FB correlation’ hereafter). With these projectiles, we have also measured the energy spectrum of SEs emitted from another carbon foil of similar thickness in the direction around 0° with respect to the incident beams. From the emission statistics data, it is found that both of the inclusive forward and backward SE yields divided by the square of the projectile atomic number (Z p ) decrease with increasing Z p . This trend is qualitatively consistent with previous works by other authors. On the other hand, it has been certified from the energy spectra that the yields of binary electron scale well with Z p 2 . As for the FB correlation, the forward- or backward-emitted SE yield decreases gradually with increasing the number of SEs emitted in the opposite directions. This so-called ‘negative FB correlation’ appears to be pronounced for He 2+ and Li 3+ ions compared with that for H + ions. Since low energy internal SEs do not contribute to the FB correlation, the observed Z p -dependent FB correlation seems to be consistent with the well Z p 2 -scaled production of high energy internal SEs and the decrease of the inclusive forward and backward SE yields with respect to this scaling

Enhancing Hydrogen Diffusion in Silica Matrix by Using Metal Ion Implantation to Improve the Emission Properties of Silicon Nanocrystals

Directory of Open Access Journals (Sweden)

J. Bornacelli

2014-01-01

Full Text Available Efficient silicon-based light emitters continue to be a challenge. A great effort has been made in photonics to modify silicon in order to enhance its light emission properties. In this aspect silicon nanocrystals (Si-NCs have become the main building block of silicon photonic (modulators, waveguide, source, and detectors. In this work, we present an approach based on implantation of Ag (or Au ions and a proper thermal annealing in order to improve the photoluminescence (PL emission of Si-NCs embedded in SiO2. The Si-NCs are obtained by ion implantation at MeV energy and nucleated at high depth into the silica matrix (1-2 μm under surface. Once Si-NCs are formed inside the SiO2 we implant metal ions at energies that do not damage the Si-NCs. We have observed by, PL and time-resolved PL, that ion metal implantation and a subsequent thermal annealing in a hydrogen-containing atmosphere could significantly increase the emission properties of Si-NCs. Elastic Recoil Detection measurements show that the samples with an enhanced luminescence emission present a higher hydrogen concentration. This suggests that ion metal implantation enhances the hydrogen diffusion into silica matrix allowing a better passivation of surface defects on Si NCs.

Energy spectrum of argon ions emitted from Filippov type Sahand plasma focus

International Nuclear Information System (INIS)

Mohammadnejad, M.; Pestehe, S. J.; Mohammadi, M. A.

2013-01-01

The energy and flux of the argon ions produced in Sahand plasma focus have been measured by employing a well-designed Faraday cup. The secondary electron emission effects on the ion signals are simulated and the dimensions of Faraday cup are optimized to minimize these effects. The measured ion energy spectrum is corrected for the ion energy loss and charge exchange in the background gas. The effects of the capacitor bank voltage and working gas pressure on the ion energy spectrum are also investigated. It has been shown that the emitted ion number per energy increases as the capacitor bank voltage increases. Decreasing the working gas pressure leads to the increase in the number of emitted ion per energy

Investigation of chemical changes in uranium oxyfluoride particles using secondary ion mass spectrometry

International Nuclear Information System (INIS)

Kips, R.S.; Kristo, M.J.

2009-01-01

Understanding how environmental conditions may affect sample composition is critical to the interpretation of laboratory analyses from environmental sampling. We prepared a set of UO 2 F 2 particle samples from the hydrolysis of UF 6 and stored these samples in environmental chambers at different temperature, humidity and lighting conditions. The NanoSIMS ion microprobe was used to measure the UF + /U + secondary ion ratio of individual particles. Monitoring variations in this ratio may provide insights on changes in particle composition over time and in response to environmental exposure. This report presents the baseline measurements carried out on freshly-prepared particle samples to determine the initial amount of fluorine. (author)

Ion implantation artifacts observed in depth profiling boron in silicon by secondary ion mass spectrometry