WorldWideScience

Sample records for scanning microscopic system

  1. Scanning tunneling microscope assembly, reactor, and system

    Science.gov (United States)

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  2. An interchangeable scanning Hall probe/scanning SQUID microscope

    International Nuclear Information System (INIS)

    Tang, Chiu-Chun; Lin, Hui-Ting; Wu, Sing-Lin; Chen, Tse-Jun; Wang, M. J.; Ling, D. C.; Chi, C. C.; Chen, Jeng-Chung

    2014-01-01

    We have constructed a scanning probe microscope for magnetic imaging, which can function as a scanning Hall probe microscope (SHPM) and as a scanning SQUID microscope (SSM). The scanning scheme, applicable to SHPM and SSM, consists of a mechanical positioning (sub) micron-XY stage and a flexible direct contact to the sample without a feedback control system for the Z-axis. With the interchangeable capability of operating two distinct scanning modes, our microscope can incorporate the advantageous functionalities of the SHPM and SSM with large scan range up to millimeter, high spatial resolution (⩽4 μm), and high field sensitivity in a wide range of temperature (4.2 K-300 K) and magnetic field (10 −7 T-1 T). To demonstrate the capabilities of the system, we present magnetic images scanned with SHPM and SSM, including a RbFeB magnet and a nickel grid pattern at room temperature, surface magnetic domain structures of a La 2/3 Ca 1/3 MnO 3 thin film at 77 K, and superconducting vortices in a striped niobium film at 4.2 K

  3. An interchangeable scanning Hall probe/scanning SQUID microscope

    Energy Technology Data Exchange (ETDEWEB)

    Tang, Chiu-Chun; Lin, Hui-Ting; Wu, Sing-Lin [Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan (China); Chen, Tse-Jun; Wang, M. J. [Institute of Astronomy and Astrophysics, Academia Sinica, Taipei 10617, Taiwan (China); Ling, D. C. [Department of Physics, Tamkang University, Tamsui Dist., New Taipei City 25137, Taiwan (China); Chi, C. C.; Chen, Jeng-Chung [Department of Physics, National Tsing Hua University, Hsinchu 30013, Taiwan (China); Frontier Research Center on Fundamental and Applied Sciences of Matters, National Tsing Hua University, Hsinchu 30013, Taiwan (China)

    2014-08-15

    We have constructed a scanning probe microscope for magnetic imaging, which can function as a scanning Hall probe microscope (SHPM) and as a scanning SQUID microscope (SSM). The scanning scheme, applicable to SHPM and SSM, consists of a mechanical positioning (sub) micron-XY stage and a flexible direct contact to the sample without a feedback control system for the Z-axis. With the interchangeable capability of operating two distinct scanning modes, our microscope can incorporate the advantageous functionalities of the SHPM and SSM with large scan range up to millimeter, high spatial resolution (⩽4 μm), and high field sensitivity in a wide range of temperature (4.2 K-300 K) and magnetic field (10{sup −7} T-1 T). To demonstrate the capabilities of the system, we present magnetic images scanned with SHPM and SSM, including a RbFeB magnet and a nickel grid pattern at room temperature, surface magnetic domain structures of a La{sub 2/3}Ca{sub 1/3}MnO{sub 3} thin film at 77 K, and superconducting vortices in a striped niobium film at 4.2 K.

  4. Scanning Color Laser Microscope

    Science.gov (United States)

    Awamura, D.; Ode, T.; Yonezawa, M.

    1988-01-01

    A confocal color laser microscope which utilizes a three color laser light source (Red: He-Ne, Green: Ar, Blue: Ar) has been developed and is finding useful applications in the semiconductor field. The color laser microscope, when compared to a conventional microscope, offers superior color separation, higher resolution, and sharper contrast. Recently some new functions including a Focus Scan Memory, a Surface Profile Measurement System, a Critical Dimension Measurement system (CD) and an Optical Beam Induced Current Function (OBIC) have been developed for the color laser microscope. This paper will discuss these new features.

  5. Polarized differential-phase laser scanning microscope

    International Nuclear Information System (INIS)

    Chou Chien; Lyu, C.-W.; Peng, L.-C.

    2001-01-01

    A polarized differential-phase laser scanning microscope, which combines a polarized optical heterodyne Mach-Zehnder interferometer and a differential amplifier to scan the topographic image of a surface, is proposed. In the experiment the differential amplifier, which acts as a PM-AM converter, in the experiment, converting phase modulation (PM) into amplitude modulation (AM). Then a novel, to our knowledge, phase demodulator was proposed and implemented for the differential-phase laser scanning microscope. An optical grating (1800 lp/mm) was imaged. The lateral and the depth resolutions of the imaging system were 0.5 μm and 1 nm, respectively. The detection accuracy, which was limited by the reflectivity variation of the test surface, is discussed

  6. Line-scanning tomographic optical microscope with isotropic transfer function

    International Nuclear Information System (INIS)

    Gajdátsy, Gábor; Dudás, László; Erdélyi, Miklós; Szabó, Gábor

    2010-01-01

    An imaging method and optical system, referred to as a line-scanning tomographic optical microscope (LSTOM) using a combination of line-scanning technique and CT reconstruction principle, is proposed and studied theoretically and experimentally. In our implementation a narrow focus line is scanned over the sample and the reflected light is measured in a confocal arrangement. One such scan is equivalent to a transverse projection in tomography. Repeating the scanning procedure in several directions, a number of transverse projections are recorded from which the image can be obtained using conventional CT reconstruction algorithms. The resolution of the image is independent of the spatial dimensions and structure of the applied detector; furthermore, the transfer function of the system is isotropic. The imaging performance of the implemented confocal LSTOM was compared with a point-scanning confocal microscope, based on recorded images. These images demonstrate that the resolution of the confocal LSTOM exceeds (by 15%) the resolution limit of a point-scanning confocal microscope

  7. Scanning tunnel microscope with large vision field compatible with a scanning electron microscope

    International Nuclear Information System (INIS)

    Volodin, A.P.; Stepanyan, G.A.; Khajkin, M.S.; Ehdel'man, V.S.

    1989-01-01

    A scanning tunnel microscope (STM) with the 20μm vision field and 1nm resolution, designed to be compatible with a scanning electron microscope (SEM), is described. The sample scanning area is chosen within the 3x10mm limits with a 0.1-1μm step. The STM needle is moved automatically toward the sample surface from the maximum distance of 10mm until the tunneling current appears. Bimorphous elements of the KP-1 piezocorrector are used in the STM design. The device is installed on a table of SEM object holders

  8. Soft control of scanning probe microscope with high flexibility.

    Science.gov (United States)

    Liu, Zhenghui; Guo, Yuzheng; Zhang, Zhaohui; Zhu, Xing

    2007-01-01

    Most commercial scanning probe microscopes have multiple embedded digital microprocessors and utilize complex software for system control, which is not easily obtained or modified by researchers wishing to perform novel and special applications. In this paper, we present a simple and flexible control solution that just depends on software running on a single-processor personal computer with real-time Linux operating system to carry out all the control tasks including negative feedback, tip moving, data processing and user interface. In this way, we fully exploit the potential of a personal computer in calculating and programming, enabling us to manipulate the scanning probe as required without any special digital control circuits and related technical know-how. This solution has been successfully applied to a homemade ultrahigh vacuum scanning tunneling microscope and a multiprobe scanning tunneling microscope.

  9. A Student-Built Scanning Tunneling Microscope

    Science.gov (United States)

    Ekkens, Tom

    2015-01-01

    Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

  10. The Scanning Optical Microscope.

    Science.gov (United States)

    Sheppard, C. J. R.

    1978-01-01

    Describes the principle of the scanning optical microscope and explains its advantages over the conventional microscope in the improvement of resolution and contrast, as well as the possibility of producing a picture from optical harmonies generated within the specimen.

  11. Confocal scanning microscope for nuclear photoemulsion

    International Nuclear Information System (INIS)

    Batusov, Yu.A.; Kovalev, Yu.S.; Soroko, L.M.

    2005-01-01

    The application of the confocal scanning microscope to the objects in the nuclear photoemulsion is described. An array of 27 microtomograms of single silver grain is shown. The cross sections of the same particle track of diameter 1 μm, detected by means of the confocal scanning microscope with open and annular apertures, are presented. It was shown that the confocal scanning microscope opens indeed new opportunities for the nuclear photoemulsion technique to get previously inaccessible information for physics of the short-living particles

  12. PC-based digital feedback control for scanning force microscope

    International Nuclear Information System (INIS)

    Mohd Ashhar Khalid

    2002-01-01

    In the past, most digital feedback implementation for scanned-probe microscope were based on a digital signal processor (DSP). At present DSP plug-in card with the input-output interface module is still expensive compared to a fast pentium PC motherboard. For a magnetic force microscope (MFM) digital feedback has an advantage where the magnetic signal can be easily separated from the topographic signal. In this paper, a simple low-cost PC-based digital feedback and imaging system for Scanning Force Microscope (SFM) is presented. (Author)

  13. Excitation-scanning hyperspectral imaging system for microscopic and endoscopic applications

    Science.gov (United States)

    Mayes, Sam A.; Leavesley, Silas J.; Rich, Thomas C.

    2016-04-01

    Current microscopic and endoscopic technologies for cancer screening utilize white-light illumination sources. Hyper-spectral imaging has been shown to improve sensitivity while retaining specificity when compared to white-light imaging in both microscopy and in vivo imaging. However, hyperspectral imaging methods have historically suffered from slow acquisition times due to the narrow bandwidth of spectral filters. Often minutes are required to gather a full image stack. We have developed a novel approach called excitation-scanning hyperspectral imaging that provides 2-3 orders of magnitude increased signal strength. This reduces acquisition times significantly, allowing for live video acquisition. Here, we describe a preliminary prototype excitation-scanning hyperspectral imaging system that can be coupled with endoscopes or microscopes for hyperspectral imaging of tissues and cells. Our system is comprised of three subsystems: illumination, transmission, and imaging. The illumination subsystem employs light-emitting diode arrays to illuminate at different wavelengths. The transmission subsystem utilizes a unique geometry of optics and a liquid light guide. Software controls allow us to interface with and control the subsystems and components. Digital and analog signals are used to coordinate wavelength intensity, cycling and camera triggering. Testing of the system shows it can cycle 16 wavelengths at as fast as 1 ms per cycle. Additionally, more than 18% of the light transmits through the system. Our setup should allow for hyperspectral imaging of tissue and cells in real time.

  14. Novel scanning probe microscope instrumentation with applications in nanotechnology

    International Nuclear Information System (INIS)

    Humphry, M.J.

    2000-10-01

    A versatile scanning probe microscope controller has been constructed. Its suitability for the control of a range of different scanning probe microscope heads has been demonstrated. These include an ultra high vacuum scanning tunnelling microscope, with which atomic resolution images of Si surfaces was obtained, a custom-built atomic force microscope, and a custom-built photon emission scanning tunnelling microscope. The controller has been designed specifically to facilitate data acquisition during molecular manipulation experiments. Using the controller, the fullerene molecule C 60 has been successfully manipulated on Si(100)-2x1 surfaces and detailed data has been acquired during the manipulation process. Evidence for two distinct modes of manipulation have been observed. A repulsive mode with success rates up to 90% was found to occur with tunnel gap impedances below 2GΩ, while between 2GΩ and 8GΩ attractive manipulation events were observed, with a maximum success rate of ∼8%. It was also found that the step size between feedback updates had a significant effect on tip stability, and that dwell time of the STM tip at each data point had a critical effect on manipulation probability. A multi-function scanning probe microscope head has been developed capable of operation as a scanning tunnelling microscope and an atomic force microscope in vacuum and a magnetic field of 7T. The custom-built controller also presented here was used to control the head. A three-axis inertial sliding motor was developed for the head, capable of reproducible step sizes of <1000A. In addition, an optical fibre interferometer was constructed with a sensitivity of 0.2A/√Hz. Preliminary development of a magnetic resonance force microscope mode has also been performed, with initial results showing such a system to be feasible. (author)

  15. Towards vortex imaging with scanning tunneling microscope

    International Nuclear Information System (INIS)

    Fuchs, Dan T.

    1994-02-01

    A low temperature, Besocke beetle type scanning tunneling microscope, with a scan range of 10 by 10 microns was built. The scanning tunneling microscope was calibrates for various temperatures and tested on several samples. Gold monolayers evaporated at 400 deg C were resolved and their dynamic behavior observed. Atomic resolution images of graphite were obtained. The scanning tunneling microscope was designed for future applications of vortex imaging in superconductors. The special design considerations for this application are discussed and the physics underlying it reviewed. (author)

  16. Small-size low-temperature scanning tunnel microscope

    International Nuclear Information System (INIS)

    Al'tfeder, I.B.; Khajkin, M.S.

    1989-01-01

    A small-size scanning tunnel microscope, designed for operation in transport helium-filled Dewar flasks is described. The microscope design contains a device moving the pin to the tested sample surface and a piezoelectric fine positioning device. High vibration protection of the microscope is provided by its suspension using silk threads. The small-size scanning tunnel microscope provides for atomic resolution

  17. NEW SCANNING DEVICE FOR SCANNING TUNNELING MICROSCOPE APPLICATIONS

    NARCIS (Netherlands)

    SAWATZKY, GA; Koops, Karl Richard

    A small, single piezo XYZ translator has been developed. The device has been used as a scanner for a scanning tunneling microscope and has been tested successfully in air and in UHV. Its simple design results in a rigid and compact scanning unit which permits high scanning rates.

  18. Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope

    NARCIS (Netherlands)

    van Hulst, N.F.; Moers, M.H.P.; Moers, M.H.P.; Noordman, O.F.J.; Noordman, O.F.J.; Faulkner, T.; Segerink, Franciscus B.; van der Werf, Kees; de Grooth, B.G.; Bölger, B.; Bölger, B.

    1992-01-01

    Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an

  19. Manipulation of magnetic Skyrmions with a Scanning Tunneling Microscope

    OpenAIRE

    Wieser, R.

    2016-01-01

    The dynamics of a single magnetic Skyrmion in an atomic spin system under the influence of Scanning Tunneling Microscope is investigated by computer simulations solving the Landau-Lifshitz-Gilbert equation. Two possible scenarios are described: manipulation with aid of a spin-polarized tunneling current and by an electric field created by the scanning tunneling microscope. The dynamics during the creation and annihilation process is studied and the possibility to move single Skyrmions is showed.

  20. Comparative study of image contrast in scanning electron microscope and helium ion microscope.

    Science.gov (United States)

    O'Connell, R; Chen, Y; Zhang, H; Zhou, Y; Fox, D; Maguire, P; Wang, J J; Rodenburg, C

    2017-12-01

    Images of Ga + -implanted amorphous silicon layers in a 110 n-type silicon substrate have been collected by a range of detectors in a scanning electron microscope and a helium ion microscope. The effects of the implantation dose and imaging parameters (beam energy, dwell time, etc.) on the image contrast were investigated. We demonstrate a similar relationship for both the helium ion microscope Everhart-Thornley and scanning electron microscope Inlens detectors between the contrast of the images and the Ga + density and imaging parameters. These results also show that dynamic charging effects have a significant impact on the quantification of the helium ion microscope and scanning electron microscope contrast. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

  1. Performance of the SRRC scanning photoelectron microscope

    CERN Document Server

    Hong, I H; Yin, G C; Wei, D H; Juang, J M; Dann, T E; Klauser, R; Chuang, T J; Chen, C T; Tsang, K L

    2001-01-01

    A scanning photoelectron microscope has been constructed at SRRC. This SPEM system consists primarily of a Fresnel zone plate (ZP) with an order-selection aperture, a flexure scanning stage, a hemispherical electron analyzer, and sample/ZP insertion system. The flexure stage is used to scan the sample. A hemispherical analyzer with Omni V lens and a 16-channel multichannel detector (MCD) is used to collect photoelectrons. A set of 16 photoelectron images at different kinetic energies can be simultaneously acquired in one single scan. The data acquisition system is designed to collect up to 32 images concurrently, including 16 MCD signals, total electron yield and transmitted photon flux. The design and some initial test results of this SPEM station are presented and discussed.

  2. Performance of the SRRC scanning photoelectron microscope

    Science.gov (United States)

    Hong, I.-H.; Lee, T.-H.; Yin, G.-C.; Wei, D.-H.; Juang, J.-M.; Dann, T.-E.; Klauser, R.; Chuang, T. J.; Chen, C. T.; Tsang, K.-L.

    2001-07-01

    A scanning photoelectron microscope has been constructed at SRRC. This SPEM system consists primarily of a Fresnel zone plate (ZP) with an order-selection aperture, a flexure scanning stage, a hemispherical electron analyzer, and sample/ZP insertion system. The flexure stage is used to scan the sample. A hemispherical analyzer with Omni V lens and a 16-channel multichannel detector (MCD) is used to collect photoelectrons. A set of 16 photoelectron images at different kinetic energies can be simultaneously acquired in one single scan. The data acquisition system is designed to collect up to 32 images concurrently, including 16 MCD signals, total electron yield and transmitted photon flux. The design and some initial test results of this SPEM station are presented and discussed.

  3. Performance of the SRRC scanning photoelectron microscope

    International Nuclear Information System (INIS)

    Hong, I.-H.; Lee, T.-H.; Yin, G.-C.; Wei, D.-H.; Juang, J.-M.; Dann, T.-E.; Klauser, R.; Chuang, T.J.; Chen, C.T.; Tsang, K.-L.

    2001-01-01

    A scanning photoelectron microscope has been constructed at SRRC. This SPEM system consists primarily of a Fresnel zone plate (ZP) with an order-selection aperture, a flexure scanning stage, a hemispherical electron analyzer, and sample/ZP insertion system. The flexure stage is used to scan the sample. A hemispherical analyzer with Omni V lens and a 16-channel multichannel detector (MCD) is used to collect photoelectrons. A set of 16 photoelectron images at different kinetic energies can be simultaneously acquired in one single scan. The data acquisition system is designed to collect up to 32 images concurrently, including 16 MCD signals, total electron yield and transmitted photon flux. The design and some initial test results of this SPEM station are presented and discussed

  4. Scanning electron microscope

    International Nuclear Information System (INIS)

    Anon.

    1980-01-01

    The principle underlying the design of the scanning electron microscope (SEM), the design and functioning of SEM are described. Its applications in the areas of microcircuitry and materials science are outlined. The development of SEM in India is reviewed. (M.G.B.)

  5. Development of Scanning Ultrafast Electron Microscope Capability.

    Energy Technology Data Exchange (ETDEWEB)

    Collins, Kimberlee Chiyoko [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Talin, Albert Alec [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Chandler, David W. [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Michael, Joseph R. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2016-11-01

    Modern semiconductor devices rely on the transport of minority charge carriers. Direct examination of minority carrier lifetimes in real devices with nanometer-scale features requires a measurement method with simultaneously high spatial and temporal resolutions. Achieving nanometer spatial resolutions at sub-nanosecond temporal resolution is possible with pump-probe methods that utilize electrons as probes. Recently, a stroboscopic scanning electron microscope was developed at Caltech, and used to study carrier transport across a Si p-n junction [ 1 , 2 , 3 ] . In this report, we detail our development of a prototype scanning ultrafast electron microscope system at Sandia National Laboratories based on the original Caltech design. This effort represents Sandia's first exploration into ultrafast electron microscopy.

  6. A transmission positron microscope and a scanning positron microscope being built at KEK, Japan

    International Nuclear Information System (INIS)

    Doyama, M.; Inoue, M.; Kogure, Y.; Kurihara, T.; Yagishita, A.; Shidara, T.; Nakahara, K.; Hayashi, Y.; Yoshiie, T.

    2001-01-01

    This paper reports the plans of positron microscopes being built at KEK (High Energy Accelerator Research Organization), Tsukuba, Japan improving used electron microscopes. The kinetic energies of positron produced by accelerators or by nuclear decays have not a unique value but show a spread over in a wide range. Positron beam will be guided near electron microscopes, a transmission electron microscope (JEM100S) and a scanning electron microscope (JSM25S). Positrons are slowed down by a tungsten foil, accelerated and focused on a nickel sheet. The monochromatic focused beam will be injected into an electron microscope. The focusing of positrons and electrons is achieved by magnetic system of the electron microscopes. Imaging plates are used to record positron images for the transmission electron microscope. (orig.)

  7. Scanning Auger Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

  8. Scanning Quantum Cryogenic Atom Microscope

    Science.gov (United States)

    Yang, Fan; Kollár, Alicia J.; Taylor, Stephen F.; Turner, Richard W.; Lev, Benjamin L.

    2017-03-01

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed-matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented dc-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a field sensitivity of 1.4 nT per resolution-limited point (approximately 2 μ m ) or 6 nT /√{Hz } per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly 100 points with an effective field sensitivity of 600 pT /√{Hz } for each point during the same time as a point-by-point scanner measures these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly 2 orders of magnitude improvement in magnetic flux sensitivity (down to 10-6 Φ0/√{Hz } ) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns in a system where samples may be scanned, cryogenically cooled, and easily exchanged. We anticipate the SQCRAMscope will provide charge-transport images at temperatures from room temperature to 4 K in unconventional superconductors and topologically nontrivial materials.

  9. Scanning electron microscopic evaluation of root canal surfaces ...

    African Journals Online (AJOL)

    Scanning electron microscopic evaluation of root canal surfaces prepared with three rotary endodontic systems: Lightspeed, ProTaper and EndoWave. ... fracture with LightSpeed (LS), ProTaper (PT) and EndoWave (Ew) rotary instruments.

  10. Imaging properties and its improvements of scanning/imaging x-ray microscope

    International Nuclear Information System (INIS)

    Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

    2016-01-01

    A scanning / imaging X-ray microscope (SIXM) system has been developed at SPring-8. The SIXM consists of a scanning X-ray microscope with a one-dimensional (1D) X-ray focusing device and an imaging (full-field) X-ray microscope with a 1D X-ray objective. The motivation of the SIXM system is to realize a quantitative and highly-sensitive multimodal 3D X-ray tomography by taking advantages of both the scanning X-ray microscope using multi-pixel detector and the imaging X-ray microscope. Data acquisition process of a 2D image is completely different between in the horizontal direction and in the vertical direction; a 1D signal is obtained with the linear-scanning while the other dimensional signal is obtained with the imaging optics. Such condition have caused a serious problem on the imaging properties that the imaging quality in the vertical direction has been much worse than that in the horizontal direction. In this paper, two approaches to solve this problem will be presented. One is introducing a Fourier transform method for phase retrieval from one phase derivative image, and the other to develop and employ a 1D diffuser to produce an asymmetrical coherent illumination

  11. Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function.

    Science.gov (United States)

    Higuchi, Seiji; Kuramochi, Hiromi; Laurent, Olivier; Komatsubara, Takashi; Machida, Shinichi; Aono, Masakazu; Obori, Kenichi; Nakayama, Tomonobu

    2010-07-01

    Over the past decade, multiple-scanning-probe microscope systems with independently controlled probes have been developed for nanoscale electrical measurements. We developed a quadruple-scanning-probe tunneling microscope (QSPTM) that can determine and control the probe position through scanning-probe imaging. The difficulty of operating multiple probes with submicrometer precision drastically increases with the number of probes. To solve problems such as determining the relative positions of the probes and avoiding of contact between the probes, we adopted sample-scanning methods to obtain four images simultaneously and developed an original control system for QSPTM operation with a function of automatic positional recognition. These improvements make the QSPTM a more practical and useful instrument since four images can now be reliably produced, and consequently the positioning of the four probes becomes easier owing to the reduced chance of accidental contact between the probes.

  12. Photon scanning tunneling microscope in combination with a force microscope

    NARCIS (Netherlands)

    Moers, M.H.P.; Moers, M.H.P.; Tack, R.G.; van Hulst, N.F.; Bölger, B.; Bölger, B.

    1994-01-01

    The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected

  13. Scanning Microscopes Using X Rays and Microchannels

    Science.gov (United States)

    Wang, Yu

    2003-01-01

    Scanning microscopes that would be based on microchannel filters and advanced electronic image sensors and that utilize x-ray illumination have been proposed. Because the finest resolution attainable in a microscope is determined by the wavelength of the illumination, the xray illumination in the proposed microscopes would make it possible, in principle, to achieve resolutions of the order of nanometers about a thousand times as fine as the resolution of a visible-light microscope. Heretofore, it has been necessary to use scanning electron microscopes to obtain such fine resolution. In comparison with scanning electron microscopes, the proposed microscopes would likely be smaller, less massive, and less expensive. Moreover, unlike in scanning electron microscopes, it would not be necessary to place specimens under vacuum. The proposed microscopes are closely related to the ones described in several prior NASA Tech Briefs articles; namely, Miniature Microscope Without Lenses (NPO-20218), NASA Tech Briefs, Vol. 22, No. 8 (August 1998), page 43; and Reflective Variants of Miniature Microscope Without Lenses (NPO-20610), NASA Tech Briefs, Vol. 26, No. 9 (September 2002) page 6a. In all of these microscopes, the basic principle of design and operation is the same: The focusing optics of a conventional visible-light microscope are replaced by a combination of a microchannel filter and a charge-coupled-device (CCD) image detector. A microchannel plate containing parallel, microscopic-cross-section holes much longer than they are wide is placed between a specimen and an image sensor, which is typically the CCD. The microchannel plate must be made of a material that absorbs the illuminating radiation reflected or scattered from the specimen. The microchannels must be positioned and dimensioned so that each one is registered with a pixel on the image sensor. Because most of the radiation incident on the microchannel walls becomes absorbed, the radiation that reaches the

  14. Development of Scanning-Imaging X-Ray Microscope for Quantitative Three-Dimensional Phase Contrast Microimaging

    International Nuclear Information System (INIS)

    Takeuchi, Akihisa; Suzuki, Yoshio; Uesugi, Kentaro

    2013-01-01

    A novel x-ray microscope system has been developed for the purpose of quantitative and sensitive three-dimensional (3D) phase-contrast x-ray microimaging. The optical system is a hybrid that consists of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. These two optics are orthogonally arranged regarding their common optical axis. Each is used for forming each dimension of two-dimensional (2D) image. The same data acquisition process as that of the scanning microscope system enables quantitative and sensitive x-ray imaging such as phase contrast and absorption contrast. Because a 2D image is measured with only 1D translation scan, much shorter measurement time than that of conventional scanning optics has been realized. By combining a computed tomography (CT) technique, some 3D CT application examples are demonstrated

  15. Metrological large range scanning probe microscope

    International Nuclear Information System (INIS)

    Dai Gaoliang; Pohlenz, Frank; Danzebrink, Hans-Ulrich; Xu Min; Hasche, Klaus; Wilkening, Guenter

    2004-01-01

    We describe a metrological large range scanning probe microscope (LR-SPM) with an Abbe error free design and direct interferometric position measurement capability, aimed at versatile traceable topographic measurements that require nanometer accuracy. A dual-stage positioning system was designed to achieve both a large measurement range and a high measurement speed. This dual-stage system consists of a commercially available stage, referred to as nanomeasuring machine (NMM), with a motion range of 25 mmx25 mmx5 mm along x, y, and z axes, and a compact z-axis piezoelectric positioning stage (compact z stage) with an extension range of 2 μm. The metrological LR-SPM described here senses the surface using a stationary fixed scanning force microscope (SFM) head working in contact mode. During operation, lateral scanning of the sample is performed solely by the NMM. Whereas the z motion, controlled by the SFM signal, is carried out by a combination of the NMM and the compact z stage. In this case the compact z stage, with its high mechanical resonance frequency (greater than 20 kHz), is responsible for the rapid motion while the NMM simultaneously makes slower movements over a larger motion range. To reduce the Abbe offset to a minimum the SFM tip is located at the intersection of three interferometer measurement beams orientated in x, y, and z directions. To improve real time performance two high-end digital signal processing (DSP) systems are used for NMM positioning and SFM servocontrol. Comprehensive DSP firmware and Windows XP-based software are implemented, providing a flexible and user-friendly interface. The instrument is able to perform large area imaging or profile scanning directly without stitching small scanned images. Several measurements on different samples such as flatness standards, nanostep height standards, roughness standards as well as sharp nanoedge samples and 1D gratings demonstrate the outstanding metrological capabilities of the instrument

  16. Laser scanning confocal microscope with programmable amplitude, phase, and polarization of the illumination beam.

    Science.gov (United States)

    Boruah, B R; Neil, M A A

    2009-01-01

    We describe the design and construction of a laser scanning confocal microscope with programmable beam forming optics. The amplitude, phase, and polarization of the laser beam used in the microscope can be controlled in real time with the help of a liquid crystal spatial light modulator, acting as a computer generated hologram, in conjunction with a polarizing beam splitter and two right angled prisms assembly. Two scan mirrors, comprising an on-axis fast moving scan mirror for line scanning and an off-axis slow moving scan mirror for frame scanning, configured in a way to minimize the movement of the scanned beam over the pupil plane of the microscope objective, form the XY scan unit. The confocal system, that incorporates the programmable beam forming unit and the scan unit, has been implemented to image in both reflected and fluorescence light from the specimen. Efficiency of the system to programmably generate custom defined vector beams has been demonstrated by generating a bottle structured focal volume, which in fact is the overlap of two cross polarized beams, that can simultaneously improve both the lateral and axial resolutions if used as the de-excitation beam in a stimulated emission depletion confocal microscope.

  17. Scanning laser microscope for imaging nanostructured superconductors

    International Nuclear Information System (INIS)

    Ishida, Takekazu; Arai, Kohei; Akita, Yukio; Miyanari, Mitsunori; Minami, Yusuke; Yotsuya, Tsutomu; Kato, Masaru; Satoh, Kazuo; Uno, Mayumi; Shimakage, Hisashi; Miki, Shigehito; Wang, Zhen

    2010-01-01

    The nanofabrication of superconductors yields various interesting features in superconducting properties. A variety of different imaging techniques have been developed for probing the local superconducting profiles. A scanning pulsed laser microscope has been developed by the combination of the XYZ piezo-driven stages and an optical fiber with an aspheric focusing lens. The scanning laser microscope is used to understand the position-dependent properties of a superconducting MgB 2 stripline of length 100 μm and width of 3 μm under constant bias current. Our results show that the superconducting stripline can clearly be seen in the contour image of the scanning laser microscope on the signal voltage. It is suggested from the observed image that the inhomogeneity is relevant in specifying the operating conditions such as detection efficiency of the sensor.

  18. Scanning laser microscope for imaging nanostructured superconductors

    Science.gov (United States)

    Ishida, Takekazu; Arai, Kohei; Akita, Yukio; Miyanari, Mitsunori; Minami, Yusuke; Yotsuya, Tsutomu; Kato, Masaru; Satoh, Kazuo; Uno, Mayumi; Shimakage, Hisashi; Miki, Shigehito; Wang, Zhen

    2010-10-01

    The nanofabrication of superconductors yields various interesting features in superconducting properties. A variety of different imaging techniques have been developed for probing the local superconducting profiles. A scanning pulsed laser microscope has been developed by the combination of the XYZ piezo-driven stages and an optical fiber with an aspheric focusing lens. The scanning laser microscope is used to understand the position-dependent properties of a superconducting MgB 2 stripline of length 100 μm and width of 3 μm under constant bias current. Our results show that the superconducting stripline can clearly be seen in the contour image of the scanning laser microscope on the signal voltage. It is suggested from the observed image that the inhomogeneity is relevant in specifying the operating conditions such as detection efficiency of the sensor.

  19. Automated detection of analyzable metaphase chromosome cells depicted on scanned digital microscopic images

    Science.gov (United States)

    Qiu, Yuchen; Wang, Xingwei; Chen, Xiaodong; Li, Yuhua; Liu, Hong; Li, Shibo; Zheng, Bin

    2010-02-01

    Visually searching for analyzable metaphase chromosome cells under microscopes is quite time-consuming and difficult. To improve detection efficiency, consistency, and diagnostic accuracy, an automated microscopic image scanning system was developed and tested to directly acquire digital images with sufficient spatial resolution for clinical diagnosis. A computer-aided detection (CAD) scheme was also developed and integrated into the image scanning system to search for and detect the regions of interest (ROI) that contain analyzable metaphase chromosome cells in the large volume of scanned images acquired from one specimen. Thus, the cytogeneticists only need to observe and interpret the limited number of ROIs. In this study, the high-resolution microscopic image scanning and CAD performance was investigated and evaluated using nine sets of images scanned from either bone marrow (three) or blood (six) specimens for diagnosis of leukemia. The automated CAD-selection results were compared with the visual selection. In the experiment, the cytogeneticists first visually searched for the analyzable metaphase chromosome cells from specimens under microscopes. The specimens were also automated scanned and followed by applying the CAD scheme to detect and save ROIs containing analyzable cells while deleting the others. The automated selected ROIs were then examined by a panel of three cytogeneticists. From the scanned images, CAD selected more analyzable cells than initially visual examinations of the cytogeneticists in both blood and bone marrow specimens. In general, CAD had higher performance in analyzing blood specimens. Even in three bone marrow specimens, CAD selected 50, 22, 9 ROIs, respectively. Except matching with the initially visual selection of 9, 7, and 5 analyzable cells in these three specimens, the cytogeneticists also selected 41, 15 and 4 new analyzable cells, which were missed in initially visual searching. This experiment showed the feasibility of

  20. A fluorescence scanning electron microscope

    International Nuclear Information System (INIS)

    Kanemaru, Takaaki; Hirata, Kazuho; Takasu, Shin-ichi; Isobe, Shin-ichiro; Mizuki, Keiji; Mataka, Shuntaro; Nakamura, Kei-ichiro

    2009-01-01

    Fluorescence techniques are widely used in biological research to examine molecular localization, while electron microscopy can provide unique ultrastructural information. To date, correlative images from both fluorescence and electron microscopy have been obtained separately using two different instruments, i.e. a fluorescence microscope (FM) and an electron microscope (EM). In the current study, a scanning electron microscope (SEM) (JEOL JXA8600 M) was combined with a fluorescence digital camera microscope unit and this hybrid instrument was named a fluorescence SEM (FL-SEM). In the labeling of FL-SEM samples, both Fluolid, which is an organic EL dye, and Alexa Fluor, were employed. We successfully demonstrated that the FL-SEM is a simple and practical tool for correlative fluorescence and electron microscopy.

  1. Improved controlled atmosphere high temperature scanning probe microscope

    DEFF Research Database (Denmark)

    Hansen, Karin Vels; Wu, Yuehua; Jacobsen, Torben

    2013-01-01

    fuel cells and electrolyzer cells. Here, we report on advanced improvements of our original controlled atmosphere high temperature scanning probe microscope, CAHT-SPM. The new microscope can employ a broad range of the scanning probe techniques including tapping mode, scanning tunneling microscopy......, scanning tunneling spectroscopy, conductive atomic force microscopy, and Kelvin probe force microscopy. The temperature of the sample can be as high as 850 °C. Both reducing and oxidizing gases such as oxygen, hydrogen, and nitrogen can be added in the sample chamber and the oxygen partial pressure (pO2...

  2. Internal scanning method as unique imaging method of optical vortex scanning microscope

    Science.gov (United States)

    Popiołek-Masajada, Agnieszka; Masajada, Jan; Szatkowski, Mateusz

    2018-06-01

    The internal scanning method is specific for the optical vortex microscope. It allows to move the vortex point inside the focused vortex beam with nanometer resolution while the whole beam stays in place. Thus the sample illuminated by the focused vortex beam can be scanned just by the vortex point. We show that this method enables high resolution imaging. The paper presents the preliminary experimental results obtained with the first basic image recovery procedure. A prospect of developing more powerful tools for topography recovery with the optical vortex scanning microscope is discussed shortly.

  3. Large Scale Scanning Probe Microscope "Making Shear Force Scanning visible."

    NARCIS (Netherlands)

    Bosma, E.; Offerhaus, Herman L.; van der Veen, Jan T.; van der Veen, J.T.; Segerink, Franciscus B.; Wessel, I.M.

    2010-01-01

    We describe a demonstration of a scanning probe microscope with shear-force tuning fork feedback. The tuning fork is several centimeters long, and the rigid fiber is replaced by a toothpick. By scaling this demonstration to visible dimensions the accessibility of shear-force scanning and tuning fork

  4. Theory of a Quantum Scanning Microscope for Cold Atoms.

    Science.gov (United States)

    Yang, D; Laflamme, C; Vasilyev, D V; Baranov, M A; Zoller, P

    2018-03-30

    We propose and analyze a scanning microscope to monitor "live" the quantum dynamics of cold atoms in a cavity QED setup. The microscope measures the atomic density with subwavelength resolution via dispersive couplings to a cavity and homodyne detection within the framework of continuous measurement theory. We analyze two modes of operation. First, for a fixed focal point the microscope records the wave packet dynamics of atoms with time resolution set by the cavity lifetime. Second, a spatial scan of the microscope acts to map out the spatial density of stationary quantum states. Remarkably, in the latter case, for a good cavity limit, the microscope becomes an effective quantum nondemolition device, such that the spatial distribution of motional eigenstates can be measured backaction free in single scans, as an emergent quantum nondemolition measurement.

  5. Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

    DEFF Research Database (Denmark)

    Jensen, Carsten P.

    Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope......Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope...

  6. Nanofabrication of magnetic scanned-probe microscope sensors

    International Nuclear Information System (INIS)

    Chong, B.K.

    2001-10-01

    This thesis presents the development of novel magnetic sensor combined with Atomic Force Microscope probe (AFM) using conventional semiconductor processing techniques and Electron Beam Lithography (EBL). The fabrication of these magnetic sensors was performed on a common micromachined silicon substrate using a generic batch fabrication technique. Sub-micron Hall bar for Scanning Hall probe Microscopy (SHPM) and electromagnetic force coil magnet for Scanning Electromagnetic Force Microscopy (eMFM) were designed and constructed at the apex of Silicon attractive mode cantilever probes. The process demonstrates good control over sensor parameters. Results indicated controllability of Hall bar junction sizes (spatial resolution) to below 100nm and Coil diameter sizes to below 500nm with minimum sizes down to 50nm and 270nm respectively. The process has shown its flexibility to accommodate different material systems. The same technology was used to fabricate multiple devices such as double Hall bars on a tip as well as a small electro-magnet coil probe co-defined with the Hall probe to form a magnetic imaging / modification probe. A conventional Non-Contact mode AFM employing heterodyne interferometry and in-house built electronics was modified for SHPM and eMFM. These probes had been scanned over a commercial computer hard disk. These microscopes showed the capability of resolving magnetic bits and topographic information independently and simultaneously. All scanning experiments were carried out under ambient conditions. The experiments required no extra preparation to be done to the specimen before imaging and measurements were carried out under ambient conditions. These probes offer the prospect of direct magnetic field measurement, non- invasiveness, very close proximity, possible local manipulation, better control over the tip- specimen interaction distance and topographic imaging. It is hoped that these magnetic microscope probes will be of great interest and

  7. Fabrication of tungsten tip for scanning tunneling microscope by the lever principle

    International Nuclear Information System (INIS)

    Wang Yang; Wang Huabin; Chinese Academy of Sciences, Beijing; Gong Jinlong; Zhu Dezhang

    2007-01-01

    A novel experimental setup was designed to fabricate tungsten tips for scanning tunneling microscope (STM), based on simple mechanical lever principle. The equipment can quickly separate the tip from electrolyte to avoid the further etching of the fine-shaped tungsten tip. The setup is advantageous for its simplicity over complex electronic control systems. The use result in scanning electron microscope demonstrates that the radius of the tip can reach 50 nm. The tip was applied to scan the surface of highly-oriented pyrolytic graphite, and the results were satisfactory. It is shown that the tip can be used for the scanning of atomically resolved images. (authors)

  8. Forensic Scanning Electron Microscope

    Science.gov (United States)

    Keeley, R. H.

    1983-03-01

    The scanning electron microscope equipped with an x-ray spectrometer is a versatile instrument which has many uses in the investigation of crime and preparation of scientific evidence for the courts. Major applications include microscopy and analysis of very small fragments of paint, glass and other materials which may link an individual with a scene of crime, identification of firearms residues and examination of questioned documents. Although simultaneous observation and chemical analysis of the sample is the most important feature of the instrument, other modes of operation such as cathodoluminescence spectrometry, backscattered electron imaging and direct x-ray excitation are also exploited. Marks on two bullets or cartridge cases can be compared directly by sequential scanning with a single beam or electronic linkage of two instruments. Particles of primer residue deposited on the skin and clothing when a gun is fired can be collected on adhesive tape and identified by their morphology and elemental composition. It is also possible to differentiate between the primer residues of different types of ammunition. Bullets may be identified from the small fragments left behind as they pass through the body tissues. In the examination of questioned documents the scanning electron microscope is used to establish the order in which two intersecting ink lines were written and to detect traces of chemical markers added to the security inks on official documents.

  9. APPLICATION OF SCANNING ELECTRON MICROSCOPE EQUIPPED WITH THE MICROANALYSIS SYSTEM FOR INVESTIGATION OF BRASS COVERING

    Directory of Open Access Journals (Sweden)

    T. P. Kurenkova

    2010-01-01

    Full Text Available The possibilities of application of scanning electronic microscope equipped with microanalysis system for investigation of the brass covering quality by slug for production of wire and metal cord particularly of change of copper concentration by covering thickness and slug perimeter, revealing of ?-phase allocation presence and character, determination of defect reasons, are shown.

  10. Scanning electron microscope facility for examination of radioactive materials

    International Nuclear Information System (INIS)

    Gibson, J.R.; Braski, D.N.

    1985-02-01

    An AMRAY model 1200B scanning electron microscope was modified to permit remote examination of radioactive specimens. Features of the modification include pneumatic vibration isolation of the column, motorized stage controls, improvements for monitoring vacuum, and a system for changing filaments without entering the hot cell

  11. Variable-temperature independently driven four-tip scanning tunneling microscope

    International Nuclear Information System (INIS)

    Hobara, Rei; Nagamura, Naoka; Hasegawa, Shuji; Matsuda, Iwao; Yamamoto, Yuko; Miyatake, Yutaka; Nagamura, Toshihiko

    2007-01-01

    The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both of the multitip STM and SEM with a single computer has also been developed, which enables the four tips to operate either for STM imaging independently and for four-point probe (4PP) conductivity measurements cooperatively. Atomic-resolution STM images of graphite were obtained simultaneously by the four tips. Conductivity measurements by 4PP method were also performed at various temperatures with the four tips in square arrangement with direct contact to the sample surface

  12. Construction of a four tip scanning tunneling microscope/scanning electron microscope combination and conductivity measurements of silicide nanowires

    International Nuclear Information System (INIS)

    Zubkov, Evgeniy

    2013-01-01

    In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7 x 7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement

  13. A compact scanning soft X-ray microscope

    International Nuclear Information System (INIS)

    Trail, J.A.

    1989-01-01

    Soft x-ray microscopes operating at wavelengths between 2.3 nm and 4.4 nm are capable of imaging wet biological cells with a resolution many times that of a visible light microscope. Several such soft x-ray microscopes have been constructed. However, with the exception of contact microscopes, all use synchrotrons as the source of soft x-ray radiation and Fresnel zone plates as the focusing optics. These synchrotron based microscopes are very successful but have the disadvantage of limited access. This dissertation reviews the construction and performance of a compact scanning soft x-ray microscope whose size and accessibility is comparable to that of an electron microscope. The microscope uses a high-brightness laser-produced plasma as the soft x-ray source and normal incidence multilayer-coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 14 nm, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 -10 5 s -1 when operated with only 170 mW of average laser power. The complete system, including the laser, fits on a single 4' x 8' optical table. The significant components of the compact microscope are the laser-produced plasma (LPP) source, the multilayer coatings, and the Schwarzschild objective. These components are reviewed, both with regard to their particular use in the current microscope and with regard to extending the microscope performance to higher resolution, higher speed, and operation at shorter wavelengths. Measurements of soft x-ray emission and debris emission from our present LPP source are presented and considerations given for an optimal LPP source. The LPP source was also used as a broadband soft x-ray source for measurement of normal incidence multilayer mirror reflectance in the 10-25 nm spectral region

  14. Integration of a high-NA light microscope in a scanning electron microscope.

    Science.gov (United States)

    Zonnevylle, A C; Van Tol, R F C; Liv, N; Narvaez, A C; Effting, A P J; Kruit, P; Hoogenboom, J P

    2013-10-01

    We present an integrated light-electron microscope in which an inverted high-NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing high-resolution optical microscopy and scanning electron microscopy on the same area of a sample simultaneously. Components for light illumination and detection can be mounted outside the vacuum, enabling flexibility in the construction of the light microscope. The light objective lens can be positioned underneath the SEM objective lens during operation for sub-10 μm alignment of the fields of view of the light and electron microscopes. We demonstrate in situ epifluorescence microscopy in the SEM with a numerical aperture of 1.4 using vacuum-compatible immersion oil. For a 40-nm-diameter fluorescent polymer nanoparticle, an intensity profile with a FWHM of 380 nm is measured whereas the SEM performance is uncompromised. The integrated instrument may offer new possibilities for correlative light and electron microscopy in the life sciences as well as in physics and chemistry. © 2013 The Authors Journal of Microscopy © 2013 Royal Microscopical Society.

  15. Sub-nanosecond time-resolved near-field scanning magneto-optical microscope.

    Science.gov (United States)

    Rudge, J; Xu, H; Kolthammer, J; Hong, Y K; Choi, B C

    2015-02-01

    We report on the development of a new magnetic microscope, time-resolved near-field scanning magneto-optical microscope, which combines a near-field scanning optical microscope and magneto-optical contrast. By taking advantage of the high temporal resolution of time-resolved Kerr microscope and the sub-wavelength spatial resolution of a near-field microscope, we achieved a temporal resolution of ∼50 ps and a spatial resolution of microscope, the magnetic field pulse induced gyrotropic vortex dynamics occurring in 1 μm diameter, 20 nm thick CoFeB circular disks has been investigated. The microscope provides sub-wavelength resolution magnetic images of the gyrotropic motion of the vortex core at a resonance frequency of ∼240 MHz.

  16. Compact, single-tube scanning tunneling microscope with thermoelectric cooling.

    Science.gov (United States)

    Jobbins, Matthew M; Agostino, Christopher J; Michel, Jolai D; Gans, Ashley R; Kandel, S Alex

    2013-10-01

    We have designed and built a scanning tunneling microscope with a compact inertial-approach mechanism that fits inside the piezoelectric scanner tube. Rigid construction allows the microscope to be operated without the use of external vibration isolators or acoustic enclosures. Thermoelectric cooling and a water-ice bath are used to increase temperature stability when scanning under ambient conditions.

  17. Local tunneling spectroscopy of a Nb/InAs/Nb superconducting proximity system with a scanning tunneling microscope

    International Nuclear Information System (INIS)

    Inoue, K.; Takayanagi, H.

    1991-01-01

    Local tunneling spectroscopy for a Nb/In/As/Nb superconducting proximity system was demonstrated with a low-temperature scanning tunneling microscope. It is found that the local electron density of states in the InAs region is spatially modulated by the neighboring superconductor Nb

  18. A New Multichannel Spectral Imaging Laser Scanning Confocal Microscope

    Directory of Open Access Journals (Sweden)

    Yunhai Zhang

    2013-01-01

    Full Text Available We have developed a new multichannel spectral imaging laser scanning confocal microscope for effective detection of multiple fluorescent labeling in the research of biological tissues. In this paper, the design and key technologies of the system are introduced. Representative results on confocal imaging, 3-dimensional sectioning imaging, and spectral imaging are demonstrated. The results indicated that the system is applicable to multiple fluorescent labeling in biological experiments.

  19. First images from the Stanford tabletop scanning soft x-ray microscope

    International Nuclear Information System (INIS)

    Trail, J.A.; Byer, R.L.

    1988-01-01

    The authors have constructed a scanning soft x-ray microscope which uses a laser-produced plasma as the soft x-ray source and normal incidence multilayer coated mirrors in a Schwarzschild configuration as the focusing optics. The microscope operates at a wavelength of 140 angstrom, has a spatial resolution of 0.5 μm, and has a soft x-ray photon flux through the focus of 10 4 s -1 when operated with only 170 mW of average laser power. The microscope is compact; the complete system, including the laser, fits on a single optical table. In this paper they describe the microscope and present images of metallic microstructures

  20. Scanning tunneling microscope nanoetching method

    Science.gov (United States)

    Li, Yun-Zhong; Reifenberger, Ronald G.; Andres, Ronald P.

    1990-01-01

    A method is described for forming uniform nanometer sized depressions on the surface of a conducting substrate. A tunneling tip is used to apply tunneling current density sufficient to vaporize a localized area of the substrate surface. The resulting depressions or craters in the substrate surface can be formed in information encoding patterns readable with a scanning tunneling microscope.

  1. Scanning Tunneling Microscope For Use In Vacuum

    Science.gov (United States)

    Abel, Phillip B.

    1993-01-01

    Scanning tunneling microscope with subangstrom resolution developed to study surface structures. Although instrument used in air, designed especially for use in vacuum. Scanning head is assembly of small, mostly rigid components made of low-outgassing materials. Includes coarse-positioning mechanical-translation stage, on which specimen mounted by use of standard mounting stub. Tunneling tip mounted on piezoelectric fine-positioning tube. Application of suitable voltages to electrodes on piezoelectric tube controls scan of tunneling tip across surface of specimen. Electronic subsystem generates scanning voltages and collects data.

  2. Atmospheric scanning electron microscope system with an open sample chamber: Configuration and applications

    Energy Technology Data Exchange (ETDEWEB)

    Nishiyama, Hidetoshi, E-mail: hinishiy@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Koizumi, Mitsuru, E-mail: koizumi@jeol.co.jp [JEOL Technics Ltd., 2-6-38 Musashino, Akishima, Tokyo 196-0021 (Japan); Ogawa, Koji, E-mail: kogawa@jeol.co.jp [JEOL Technics Ltd., 2-6-38 Musashino, Akishima, Tokyo 196-0021 (Japan); Kitamura, Shinich, E-mail: kitamura@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Konyuba, Yuji, E-mail: ykonyuub@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Watanabe, Yoshiyuki, E-mail: watanabeyoshiy@pref.yamagata.jp [Yamagata Research Institute of Technology, 2-2-1, Matsuei, Yamagata 990-2473 (Japan); Ohbayashi, Norihiko, E-mail: n.ohbayashi@m.tohoku.ac.jp [Laboratory of Membrane Trafficking Mechanisms, Department of Developmental Biology and Neurosciences, Graduate School of Life Sciences, Tohoku University, Aobayama, Aoba-ku, Sendai, Miyagi 980-8578 (Japan); Fukuda, Mitsunori, E-mail: nori@m.tohoku.ac.jp [Laboratory of Membrane Trafficking Mechanisms, Department of Developmental Biology and Neurosciences, Graduate School of Life Sciences, Tohoku University, Aobayama, Aoba-ku, Sendai, Miyagi 980-8578 (Japan); Suga, Mitsuo, E-mail: msuga@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Sato, Chikara, E-mail: ti-sato@aist.go.jp [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-4, Umezono, Tsukuba 305-8568 (Japan)

    2014-12-15

    An atmospheric scanning electron microscope (ASEM) with an open sample chamber and optical microscope (OM) is described and recent developments are reported. In this ClairScope system, the base of the open sample dish is sealed to the top of the inverted SEM column, allowing the liquid-immersed sample to be observed by OM from above and by SEM from below. The optical axes of the two microscopes are aligned, ensuring that the same sample areas are imaged to realize quasi-simultaneous correlative microscopy in solution. For example, the cathodoluminescence of ZnO particles was directly demonstrated. The improved system has (i) a fully motorized sample stage, (ii) a column protection system in the case of accidental window breakage, and (iii) an OM/SEM operation system controlled by a graphical user interface. The open sample chamber allows the external administration of reagents during sample observation. We monitored the influence of added NaCl on the random motion of silica particles in liquid. Further, using fluorescence as a transfection marker, the effect of small interfering RNA-mediated knockdown of endogenous Varp on Tyrp1 trafficking in melanocytes was examined. A temperature-regulated titanium ASEM dish allowed the dynamic observation of colloidal silver nanoparticles as they were heated to 240 °C and sintered. - Highlights: • Atmospheric SEM (ASEM) allows observation of samples in liquid or gas. • Open sample chamber allows in situ monitoring of evaporation and sintering processes. • in situ monitoring of processes during reagent administration is also accomplished. • Protection system for film breakage is developed for ASEM. • Usability of ASEM has been improved significantly including GUI control.

  3. Atmospheric scanning electron microscope system with an open sample chamber: Configuration and applications

    International Nuclear Information System (INIS)

    Nishiyama, Hidetoshi; Koizumi, Mitsuru; Ogawa, Koji; Kitamura, Shinich; Konyuba, Yuji; Watanabe, Yoshiyuki; Ohbayashi, Norihiko; Fukuda, Mitsunori; Suga, Mitsuo; Sato, Chikara

    2014-01-01

    An atmospheric scanning electron microscope (ASEM) with an open sample chamber and optical microscope (OM) is described and recent developments are reported. In this ClairScope system, the base of the open sample dish is sealed to the top of the inverted SEM column, allowing the liquid-immersed sample to be observed by OM from above and by SEM from below. The optical axes of the two microscopes are aligned, ensuring that the same sample areas are imaged to realize quasi-simultaneous correlative microscopy in solution. For example, the cathodoluminescence of ZnO particles was directly demonstrated. The improved system has (i) a fully motorized sample stage, (ii) a column protection system in the case of accidental window breakage, and (iii) an OM/SEM operation system controlled by a graphical user interface. The open sample chamber allows the external administration of reagents during sample observation. We monitored the influence of added NaCl on the random motion of silica particles in liquid. Further, using fluorescence as a transfection marker, the effect of small interfering RNA-mediated knockdown of endogenous Varp on Tyrp1 trafficking in melanocytes was examined. A temperature-regulated titanium ASEM dish allowed the dynamic observation of colloidal silver nanoparticles as they were heated to 240 °C and sintered. - Highlights: • Atmospheric SEM (ASEM) allows observation of samples in liquid or gas. • Open sample chamber allows in situ monitoring of evaporation and sintering processes. • in situ monitoring of processes during reagent administration is also accomplished. • Protection system for film breakage is developed for ASEM. • Usability of ASEM has been improved significantly including GUI control

  4. Atmospheric scanning electron microscope for correlative microscopy.

    Science.gov (United States)

    Morrison, Ian E G; Dennison, Clare L; Nishiyama, Hidetoshi; Suga, Mitsuo; Sato, Chikara; Yarwood, Andrew; O'Toole, Peter J

    2012-01-01

    The JEOL ClairScope is the first truly correlative scanning electron and optical microscope. An inverted scanning electron microscope (SEM) column allows electron images of wet samples to be obtained in ambient conditions in a biological culture dish, via a silicon nitride film window in the base. A standard inverted optical microscope positioned above the dish holder can be used to take reflected light and epifluorescence images of the same sample, under atmospheric conditions that permit biochemical modifications. For SEM, the open dish allows successive staining operations to be performed without moving the holder. The standard optical color camera used for fluorescence imaging can be exchanged for a high-sensitivity monochrome camera to detect low-intensity fluorescence signals, and also cathodoluminescence emission from nanophosphor particles. If these particles are applied to the sample at a suitable density, they can greatly assist the task of perfecting the correlation between the optical and electron images. Copyright © 2012 Elsevier Inc. All rights reserved.

  5. Geometrical modelling of scanning probe microscopes and characterization of errors

    International Nuclear Information System (INIS)

    Marinello, F; Savio, E; Bariani, P; Carmignato, S

    2009-01-01

    Scanning probe microscopes (SPMs) allow quantitative evaluation of surface topography with ultra-high resolution, as a result of accurate actuation combined with the sharpness of tips. SPMs measure sequentially, by scanning surfaces in a raster fashion: topography maps commonly consist of data sets ideally reported in an orthonormal rectilinear Cartesian coordinate system. However, due to scanning errors and measurement distortions, the measurement process is far from the ideal Cartesian condition. The paper addresses geometrical modelling of the scanning system dynamics, presenting a mathematical model which describes the surface metric x-, y- and z- coordinates as a function of the measured x'-, y'- and z'-coordinates respectively. The complete mathematical model provides a relevant contribution to characterization and calibration, and ultimately to traceability, of SPMs, when applied for quantitative characterization

  6. Seamless stitching of tile scan microscope images.

    Science.gov (United States)

    Legesse, F B; Chernavskaia, O; Heuke, S; Bocklitz, T; Meyer, T; Popp, J; Heintzmann, R

    2015-06-01

    For diagnostic purposes, optical imaging techniques need to obtain high-resolution images of extended biological specimens in reasonable time. The field of view of an objective lens, however, is often smaller than the sample size. To image the whole sample, laser scanning microscopes acquire tile scans that are stitched into larger mosaics. The appearance of such image mosaics is affected by visible edge artefacts that arise from various optical aberrations which manifest in grey level jumps across tile boundaries. In this contribution, a technique for stitching tiles into a seamless mosaic is presented. The stitching algorithm operates by equilibrating neighbouring edges and forcing the brightness at corners to a common value. The corrected image mosaics appear to be free from stitching artefacts and are, therefore, suited for further image analysis procedures. The contribution presents a novel method to seamlessly stitch tiles captured by a laser scanning microscope into a large mosaic. The motivation for the work is the failure of currently existing methods for stitching nonlinear, multimodal images captured by our microscopic setups. Our method eliminates the visible edge artefacts that appear between neighbouring tiles by taking into account the overall illumination differences among tiles in such mosaics. The algorithm first corrects the nonuniform brightness that exists within each of the tiles. It then compensates for grey level differences across tile boundaries by equilibrating neighbouring edges and forcing the brightness at the corners to a common value. After these artefacts have been removed further image analysis procedures can be applied on the microscopic images. Even though the solution presented here is tailored for the aforementioned specific case, it could be easily adapted to other contexts where image tiles are assembled into mosaics such as in astronomical or satellite photos. © 2015 The Authors Journal of Microscopy © 2015 Royal

  7. Closed-Loop Autofocus Scheme for Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Cui Le

    2015-01-01

    Full Text Available In this paper, we present a full scale autofocus approach for scanning electron microscope (SEM. The optimal focus (in-focus position of the microscope is achieved by maximizing the image sharpness using a vision-based closed-loop control scheme. An iterative optimization algorithm has been designed using the sharpness score derived from image gradient information. The proposed method has been implemented and validated using a tungsten gun SEM at various experimental conditions like varying raster scan speed, magnification at real-time. We demonstrate that the proposed autofocus technique is accurate, robust and fast.

  8. Design of a scanning gate microscope for mesoscopic electron systems in a cryogen-free dilution refrigerator.

    Science.gov (United States)

    Pelliccione, M; Sciambi, A; Bartel, J; Keller, A J; Goldhaber-Gordon, D

    2013-03-01

    We report on our design of a scanning gate microscope housed in a cryogen-free dilution refrigerator with a base temperature of 15 mK. The recent increase in efficiency of pulse tube cryocoolers has made cryogen-free systems popular in recent years. However, this new style of cryostat presents challenges for performing scanning probe measurements, mainly as a result of the vibrations introduced by the cryocooler. We demonstrate scanning with root-mean-square vibrations of 0.8 nm at 3 K and 2.1 nm at 15 mK in a 1 kHz bandwidth with our design. Using Coulomb blockade thermometry on a GaAs/AlGaAs gate-defined quantum dot, we demonstrate an electron temperature of 45 mK.

  9. Scanning Electron Microscope Analysis System

    Data.gov (United States)

    Federal Laboratory Consortium — This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and...

  10. Possible Laminographic and Tomosynthesis Applications for Wolter Microscope Scan Geometries

    International Nuclear Information System (INIS)

    Schneberk, D; Jackson, J; Martz, H

    2004-01-01

    The Wolter microscope includes a number of attractive features for x-ray imaging, and possible connections to laminographic and tomosynthesis 3D object recovery algorithms. This type of instrument employs x-ray optics to sift out single energy x-rays from a broader spectral energy source, and direct those x-rays to a ''focus plane'' similar to the operation of a optical microscope (see Figure 1 for schematic of a Wolter instrument). Unlike optical microscopes the 3D object can be thick in the direction of the x-rays and in this case more of the intensity of the image is affected by the out-of-focus planes, since the ray-paths span the entire depth of the object. It is clear that the ''in-focus'' plane of a Wolter contain more 3D information than a simple ''point-projection'' radiograph. However, it is not clear just how the impact of the out-of-focus planes obscures or distorts features of interest for the in-focus planes. Further, it is not clear just how object positioning can be combined with multiple acquisitions to enable recovery of other planes within the object function or the entire object function. Of particular interest here are Wolter microscopes configured for mesoscale objects (mm extent with um features). Laminographic and tomosynthesis scanning methods can be strategic for this type of inspection instrument. First, photon output for inspection purposes can be meager in this type of ''small field of view'' system. With laboratory x-ray sources a single image can require up to 10 minutes to accumulate adequate signal. Techniques that can obtain 3D object information from small numbers of views, rotational or translational, are consequently at a premium. Laminographic and tomosynthesis scanning methods require relatively small numbers of views (2-30). Secondly, the Wolter microscope scan geometry in a single view is a fit with the type of source-detector geometry achieved through source-object-detector re-positioning in laminographic and tomosynthesis

  11. Indigenous development of scanning electron microscope

    International Nuclear Information System (INIS)

    Ambastha, K.P.; Chaudhari, Y.V.; Pal, Suvadip; Tikaria, Amit; Pious, Lizy; Dubey, B.P.; Chadda, V.K.

    2009-01-01

    Scanning electron microscope (SEM) is a precision instrument and plays very important role in scientific studies. Bhabha Atomic Research Centre has taken up the job of development of SEM indigenously. Standard and commercially available components like computer, high voltage power supply, detectors etc. shall be procured from market. Focusing and scanning coils, vacuum chamber, specimen stage, control hardware and software etc. shall be developed at BARC with the help of Indian industry. Procurement, design and fabrication of various parts of SEM are in progress. (author)

  12. Design and performance of a beetle-type double-tip scanning tunneling microscope

    International Nuclear Information System (INIS)

    Jaschinsky, Philipp; Coenen, Peter; Pirug, Gerhard; Voigtlaender, Bert

    2006-01-01

    A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip

  13. A scanning tunneling microscope with a scanning range from hundreds of micrometers down to nanometer resolution.

    Science.gov (United States)

    Kalkan, Fatih; Zaum, Christopher; Morgenstern, Karina

    2012-10-01

    A beetle type stage and a flexure scanning stage are combined to form a two stages scanning tunneling microscope (STM). It operates at room temperature in ultrahigh vacuum and is capable of scanning areas up to 300 μm × 450 μm down to resolution on the nanometer scale. This multi-scale STM has been designed and constructed in order to investigate prestructured metallic or semiconducting micro- and nano-structures in real space from atomic-sized structures up to the large-scale environment. The principle of the instrument is demonstrated on two different systems. Gallium nitride based micropillars demonstrate scan areas up to hundreds of micrometers; a Au(111) surface demonstrates nanometer resolution.

  14. Scanning tunneling microscopic images and scanning tunneling spectra for coupled rectangular quantum corrals

    International Nuclear Information System (INIS)

    Mitsuoka, Shigenori; Tamura, Akira

    2011-01-01

    Assuming that an electron confined by double δ-function barriers lies in a quasi-stationary state, we derived eigenstates and eigenenergies of the electron. Such an electron has a complex eigenenergy, and the imaginary part naturally leads to the lifetime of the electron associated with tunneling through barriers. We applied this point of view to the electron confined in a rectangular quantum corral (QC) on a noble metal surface, and obtained scanning tunneling microscopic images and a scanning tunneling spectrum consistent with experimental ones. We investigated the electron states confined in coupled QCs and obtained the coupled states constructed with bonding and anti-bonding states. Using those energy levels and wavefunctions we specified scanning tunneling microscope (STM) images and scanning tunneling spectra (STS) for the doubly and triply coupled QCs. In addition we pointed out the feature of resonant electron states associated with the same QCs at both ends of the triply coupled QCs.

  15. A multiphoton laser scanning microscope setup for transcranial in vivo brain imaging on mice

    Science.gov (United States)

    Nase, Gabriele; Helm, P. Johannes; Reppen, Trond; Ottersen, Ole Petter

    2005-12-01

    We describe a multiphoton laser scanning microscope setup for transcranial in vivo brain imaging in mice. The modular system is based on a modified industrial standard Confocal Scanning Laser Microscope (CSLM) and is assembled mainly from commercially available components. A special multifunctional stage, which is optimized for both laser scanning microscopic observation and preparative animal surgery, has been developed and built. The detection unit includes a highly efficient photomultiplier tube installed in a Peltier-cooled thermal box shielding the detector from changes in room temperature and from distortions caused by external electromagnetic fields. The images are recorded using a 12-bit analog-to-digital converter. Depending on the characteristics of the staining, individual nerve cells can be imaged down to at least 100μm below the intact cranium and down to at least 200μm below the opened cranium.

  16. A combined scanning tunnelling microscope and x-ray interferometer

    Science.gov (United States)

    Yacoot, Andrew; Kuetgens, Ulrich; Koenders, Ludger; Weimann, Thomas

    2001-10-01

    A monolithic x-ray interferometer made from silicon and a scanning tunnelling microscope have been combined and used to calibrate grating structures with periodicities of 100 nm or less. The x-ray interferometer is used as a translation stage which moves in discrete steps of 0.192 nm, the lattice spacing of the silicon (220) planes. Hence, movements are traceable to the definition of the metre and the nonlinearity associated with the optical interferometers used to measure displacement in more conventional metrological scanning probe microscopes (MSPMs) removed.

  17. Measuring voltage transients with an ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1997-01-01

    circuit, where the tunneling tip is directly connected to the current amplifier of the scanning tunneling microscope, this dependence is eliminated. Ail results can be explained with coupling through the geometrical capacitance of the tip-electrode junction. By illuminating the current......We use an ultrafast scanning tunneling microscope to resolve propagating voltage transients in space and time. We demonstrate that the previously observed dependence of the transient signal amplitude on the tunneling resistance was only caused by the electrical sampling circuit. With a modified...

  18. Compact design of a transmission electron microscope-scanning tunneling microscope holder with three-dimensional coarse motion

    International Nuclear Information System (INIS)

    Svensson, K.; Jompol, Y.; Olin, H.; Olsson, E.

    2003-01-01

    A scanning tunneling microscope (STM) with a compact, three-dimensional, inertial slider design is presented. Inertial sliding of the STM tip, in three dimensions, enables coarse motion and scanning using only one piezoelectric tube. Using the same electronics both for scanning and inertial sliding, step lengths of less than 5% of the piezo range were achieved. The compact design, less than 1 cm3 in volume, ensures a low mechanical noise level and enables us to fit the STM into the sample holder of a transmission electron microscope (TEM), while maintaining atomic scale resolution in both STM and TEM imaging

  19. Gwyscan: a library to support non-equidistant scanning probe microscope measurements

    International Nuclear Information System (INIS)

    Klapetek, Petr; Grolich, Petr; Valtr, Miroslav; Yacoot, Andrew; Nečas, David

    2017-01-01

    We present a software library and related methodology for enabling easy integration of adaptive step (non-equidistant) scanning techniques into metrological scanning probe microscopes or scanning probe microscopes where individual x , y position data are recorded during measurements. Scanning with adaptive steps can reduce the amount of data collected in SPM measurements thereby leading to faster data acquisition, a smaller amount of data collection required for a specific analytical task and less sensitivity to mechanical and thermal drift. Implementation of adaptive scanning routines into a custom built microscope is not normally an easy task: regular data are much easier to handle for previewing (e.g. levelling) and storage. We present an environment to make implementation of adaptive scanning easier for an instrument developer, specifically taking into account data acquisition approaches that are used in high accuracy microscopes as those developed by National Metrology Institutes. This includes a library with algorithms written in C and LabVIEW for handling data storage, regular mesh preview generation and planning the scan path on basis of different assumptions. A set of modules for Gwyddion open source software for handling these data and for their further analysis is presented. Using this combination of data acquisition and processing tools one can implement adaptive scanning in a relatively easy way into an instrument that was previously measuring on a regular grid. The performance of the presented approach is shown and general non-equidistant data processing steps are discussed. (paper)

  20. Gwyscan: a library to support non-equidistant scanning probe microscope measurements

    Science.gov (United States)

    Klapetek, Petr; Yacoot, Andrew; Grolich, Petr; Valtr, Miroslav; Nečas, David

    2017-03-01

    We present a software library and related methodology for enabling easy integration of adaptive step (non-equidistant) scanning techniques into metrological scanning probe microscopes or scanning probe microscopes where individual x, y position data are recorded during measurements. Scanning with adaptive steps can reduce the amount of data collected in SPM measurements thereby leading to faster data acquisition, a smaller amount of data collection required for a specific analytical task and less sensitivity to mechanical and thermal drift. Implementation of adaptive scanning routines into a custom built microscope is not normally an easy task: regular data are much easier to handle for previewing (e.g. levelling) and storage. We present an environment to make implementation of adaptive scanning easier for an instrument developer, specifically taking into account data acquisition approaches that are used in high accuracy microscopes as those developed by National Metrology Institutes. This includes a library with algorithms written in C and LabVIEW for handling data storage, regular mesh preview generation and planning the scan path on basis of different assumptions. A set of modules for Gwyddion open source software for handling these data and for their further analysis is presented. Using this combination of data acquisition and processing tools one can implement adaptive scanning in a relatively easy way into an instrument that was previously measuring on a regular grid. The performance of the presented approach is shown and general non-equidistant data processing steps are discussed.

  1. How the confocal laser scanning microscope entered biological research.

    Science.gov (United States)

    Amos, W B; White, J G

    2003-09-01

    A history of the early development of the confocal laser scanning microscope in the MRC Laboratory of Molecular Biology in Cambridge is presented. The rapid uptake of this technology is explained by the wide use of fluorescence in the 80s. The key innovations were the scanning of the light beam over the specimen rather than vice-versa and a high magnification at the level of the detector, allowing the use of a macroscopic iris. These were followed by an achromatic all-reflective relay system, a non-confocal transmission detector and novel software for control and basic image processing. This design was commercialized successfully and has been produced and developed over 17 years, surviving challenges from alternative technologies, including solid-state scanning systems. Lessons are pointed out from the unusual nature of the original funding and research environment. Attention is drawn to the slow adoption of the instrument in diagnostic medicine, despite promising applications.

  2. A compact combined ultrahigh vacuum scanning tunnelling microscope (UHV STM) and near-field optical microscope

    International Nuclear Information System (INIS)

    Woolley, R A J; Hayton, J A; Cavill, S; Ma, Jin; Beton, P H; Moriarty, P

    2008-01-01

    We have designed and constructed a hybrid scanning near-field optical microscope (SNOM)–scanning tunnelling microscope (STM) instrument which operates under ultrahigh vacuum (UHV) conditions. Indium tin oxide (ITO)-coated fibre-optic tips capable of high quality STM imaging and tunnelling spectroscopy are fabricated using a simple and reliable method which foregoes the electroless plating strategy previously employed by other groups. The fabrication process is reproducible, producing robust tips which may be exchanged under UHV conditions. We show that controlled contact with metal surfaces considerably enhances the STM imaging capabilities of fibre-optic tips. Light collection (from the cleaved back face of the ITO-coated fibre-optic tip) and optical alignment are facilitated by a simple two-lens arrangement where the in-vacuum collimation/collection lens may be adjusted using a slip-stick motor. A second in-air lens focuses the light (which emerges from the UHV system as a parallel beam) onto a cooled CCD spectrograph or photomultiplier tube. The application of the instrument to combined optical and electronic spectroscopy of Au and GaAs surfaces is discussed

  3. Focal depth measurement of scanning helium ion microscope

    International Nuclear Information System (INIS)

    Guo, Hongxuan; Itoh, Hiroshi; Wang, Chunmei; Zhang, Han; Fujita, Daisuke

    2014-01-01

    When facing the challenges of critical dimension measurement of complicated nanostructures, such as of the three dimension integrated circuit, characterization of the focal depth of microscopes is important. In this Letter, we developed a method for characterizing the focal depth of a scanning helium ion microscope (HIM) by using an atomic force microscope tip characterizer (ATC). The ATC was tilted in a sample chamber at an angle to the scanning plan. Secondary electron images (SEIs) were obtained at different positions of the ATC. The edge resolution of the SEIs shows the nominal diameters of the helium ion beam at different focal levels. With this method, the nominal shapes of the helium ion beams were obtained with different apertures. Our results show that a small aperture is necessary to get a high spatial resolution and high depth of field images with HIM. This work provides a method for characterizing and improving the performance of HIM.

  4. Electron optical characteristics of a concave electrostatic electron mirror for a scanning electron microscope

    International Nuclear Information System (INIS)

    Hamarat, R.T.; Witzani, J.; Hoerl, E.M.

    1984-08-01

    Numerical computer calculations are used to explore the design characteristics of a concave electrostatic electron mirror for a mirror attachment for a conventional scanning electron microscope or an instrument designed totally as a scanning electron mirror microscope. The electron paths of a number of set-ups are calculated and drawn graphically in order to find the optimum shape and dimensions of the mirror geometry. This optimum configuration turns out to be the transition configuration between two cases of electron path deflection, towards the optical axis of the system and away from it. (Author)

  5. The Scanning Theremin Microscope: A Model Scanning Probe Instrument for Hands-On Activities

    Science.gov (United States)

    Quardokus, Rebecca C.; Wasio, Natalie A.; Kandel, S. Alex

    2014-01-01

    A model scanning probe microscope, designed using similar principles of operation to research instruments, is described. Proximity sensing is done using a capacitance probe, and a mechanical linkage is used to scan this probe across surfaces. The signal is transduced as an audio tone using a heterodyne detection circuit analogous to that used in…

  6. Observation of quantized vortices by cryocooler-based scanning Hall probe microscope

    Energy Technology Data Exchange (ETDEWEB)

    Tokunaga, Y.; Konishi, Y.; Tokunaga, M.; Tamegai, T

    2004-10-01

    We have developed a scanning Hall probe microscope (SHPM) system utilizing closed-cycle cryocooler. The Hall probe used in this system is fabricated from a GaAs/GaAlAs two-dimensional electron gas. A stepping-motor-driven XYZ translator is used with a resolution better than 0.1 {mu}m and maximum scan range of 20 x 20 mm{sup 2}. The spatial resolution of the system is about 5 {mu}m and magnetic resolution is about 100 mG. By using this system, we have successfully resolved the quantized vortices on the cleaved surface of Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8+y} single crystal.

  7. Design and calibration of a vacuum compatible scanning tunneling microscope

    Science.gov (United States)

    Abel, Phillip B.

    1990-01-01

    A vacuum compatible scanning tunneling microscope was designed and built, capable of imaging solid surfaces with atomic resolution. The single piezoelectric tube design is compact, and makes use of sample mounting stubs standard to a commercially available surface analysis system. Image collection and display is computer controlled, allowing storage of images for further analysis. Calibration results from atomic scale images are presented.

  8. A Scanning Quantum Cryogenic Atom Microscope

    Science.gov (United States)

    Lev, Benjamin

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a field sensitivity of 1.4 nT per resolution-limited point (2 um), or 6 nT / Hz1 / 2 per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly one-hundred points with an effective field sensitivity of 600 pT / Hz1 / 2 each point during the same time as a point-by-point scanner would measure these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly two orders of magnitude improvement in magnetic flux sensitivity (down to 10- 6 Phi0 / Hz1 / 2) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are for the first time carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns and done so using samples that may be scanned, cryogenically cooled, and easily exchanged. We anticipate the SQCRAMscope will provide charge transport images at temperatures from room to \\x9D4K in unconventional superconductors and topologically nontrivial materials.

  9. Scanning tunneling microscope for magneto-optical imaging

    NARCIS (Netherlands)

    Prins, M.W.J.; Groeneveld, R.H.M.; Abraham, D.L.; Schad, R.; Kempen, van H.; Kesteren, van H.W.

    1996-01-01

    Images of magnetic bits written in a Pt/Co multilayer are presented. Using photosensitive semiconducting tips in a scanning tunneling microscope the surface topography as well as the polarization-dependent optical transmission are measured. Magnetic contrast is achieved by detection of the Faraday

  10. Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope

    International Nuclear Information System (INIS)

    Sychugov, Ilya; Omi, Hiroo; Murashita, Tooru; Kobayashi, Yoshihiro

    2009-01-01

    A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.

  11. Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

    Science.gov (United States)

    Jones, L; Nellist, P D

    2014-05-01

    In the scanning transmission electron microscope, hardware aberration correctors can now correct for the positive spherical aberration of round electron lenses. These correctors make use of nonround optics such as hexapoles or octupoles, leading to the limiting aberrations often being of a nonround type. Here we explore the effect of a number of potential limiting aberrations on the imaging performance of the scanning transmission electron microscope through their resulting optical transfer functions. In particular, the response of the optical transfer function to changes in defocus are examined, given that this is the final aberration to be tuned just before image acquisition. The resulting three-dimensional optical transfer functions also allow an assessment of the performance of a system for focal-series experiments or optical sectioning applications. © 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.

  12. Development of Near-Field Microwave Microscope with the Functionality of Scanning Tunneling Spectroscopy

    Science.gov (United States)

    Machida, Tadashi; Gaifullin, Marat B.; Ooi, Shuuich; Kato, Takuya; Sakata, Hideaki; Hirata, Kazuto

    2010-11-01

    We describe the details of an original near-field scanning microwave microscope, developed for simultaneous measurements of local density-of-states (LDOS) and local ohmic losses (LOL). Improving microwave detection systems, we have succeeded in distinguishing the LDOS and LOL even between two low resistance materials; gold and highly orientated pyrolitic graphite. The experimental data indicate that our microscope holds a capability to investigate both LDOS and LOL in nanoscale.

  13. Fully low voltage and large area searching scanning tunneling microscope

    International Nuclear Information System (INIS)

    Pang, Zongqiang; Wang, Jihui; Lu, Qingyou

    2009-01-01

    We present a novel scanning tunneling microscope (STM), which allows the tip to travel a large distance (millimeters) on the sample and take images (to find microscopic targets) anywhere it reaches without losing atomic resolution. This broad range searching capability, together with the coarse approach and scan motion, is all done with only one single piezoelectric tube scanner as well as with only low voltages (<15 V). Simple structure, low interference and high precision are thus achieved. To this end, a pillar and a tube scanner are mounted in parallel on a base with one ball glued on the pillar top and two balls glued on the scanner top. These three balls form a narrow triangle, which supports a triangular slider piece. By inertial stepping, the scanner can move the slider toward the pillar (coarse approach) or rotate the slider about the pillar (travel along sample surface). Since all the stepping motions are driven by the scanner's lateral bending which is large per unit voltage, high voltages are unnecessary. The technology is also applicable to scanning force microscopes (SFM) such as atomic force microscopes (AFM), etc

  14. Field programmable gate array based reconfigurable scanning probe/optical microscope.

    Science.gov (United States)

    Nowak, Derek B; Lawrence, A J; Dzegede, Zechariah K; Hiester, Justin C; Kim, Cliff; Sánchez, Erik J

    2011-10-01

    The increasing popularity of nanometrology and nanospectroscopy has pushed researchers to develop complex new analytical systems. This paper describes the development of a platform on which to build a microscopy tool that will allow for flexibility of customization to suit research needs. The novelty of the described system lies in its versatility of capabilities. So far, one version of this microscope has allowed for successful near-field and far-field fluorescence imaging with single molecule detection sensitivity. This system is easily adapted for reflection, polarization (Kerr magneto-optical (MO)), Raman, super-resolution techniques, and other novel scanning probe imaging and spectroscopic designs. While collecting a variety of forms of optical images, the system can simultaneously monitor topographic information of a sample with an integrated tuning fork based shear force system. The instrument has the ability to image at room temperature and atmospheric pressure or under liquid. The core of the design is a field programmable gate array (FPGA) data acquisition card and a single, low cost computer to control the microscope with analog control circuitry using off-the-shelf available components. A detailed description of electronics, mechanical requirements, and software algorithms as well as examples of some different forms of the microscope developed so far are discussed.

  15. Configurations of the Re-scan Confocal Microscope (RCM) for biomedical applications

    NARCIS (Netherlands)

    de Luca, G. M. R.; Desclos, E.; Breedijk, R. M. P.; Dolz-Edo, L.; Smits, G. J.; Bielefeld, P.; Picavet, L.; Fitzsimons, C. P.; Hoebe, R.; Manders, E. M. M.

    2017-01-01

    The new high-sensitive and high-resolution technique, Re-scan Confocal Microscopy (RCM), is based on a standard confocal microscope extended with a re-scan detection unit. The re-scan unit includes a pair of re-scanning mirrors that project the emission light onto a camera in a scanning manner. The

  16. Configurations of the Re-scan Confocal Microscope (RCM) for biomedical applications

    NARCIS (Netherlands)

    De Luca, G.M.R.; Desclos, E.; Breedijk, R.M.P.; Dolz-Edo, L.; Smits, G.J.; Nahidiazar, L.; Bielefeld, P.; Picavet, L.; Fitzsimons, C.P.; Hoebe, R.; Manders, E.M.M.

    The new high-sensitive and high-resolution technique, Re-scan Confocal Microscopy (RCM), is based on a standard confocal microscope extended with a re-scan detection unit. The re-scan unit includes a pair of re-scanning mirrors that project the emission light onto a camera in a scanning manner. The

  17. Transmission environmental scanning electron microscope with scintillation gaseous detection device

    International Nuclear Information System (INIS)

    Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

    2015-01-01

    A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. - Highlights: • Novel scanning transmission electron microscopy (STEM) with an environmental scanning electron microscope (ESEM) called TESEM. • Use of the gaseous detection device (GDD) in scintillation mode that allows high resolution bright and dark field imaging in the TESEM. • Novel approach towards a unification of both vacuum and environmental conditions in both bulk/surface and transmission mode of electron microscopy

  18. Versatile variable temperature and magnetic field scanning probe microscope for advanced material research

    Science.gov (United States)

    Jung, Jin-Oh; Choi, Seokhwan; Lee, Yeonghoon; Kim, Jinwoo; Son, Donghyeon; Lee, Jhinhwan

    2017-10-01

    We have built a variable temperature scanning probe microscope (SPM) that covers 4.6 K-180 K and up to 7 T whose SPM head fits in a 52 mm bore magnet. It features a temperature-controlled sample stage thermally well isolated from the SPM body in good thermal contact with the liquid helium bath. It has a 7-sample-holder storage carousel at liquid helium temperature for systematic studies using multiple samples and field emission targets intended for spin-polarized spectroscopic-imaging scanning tunneling microscopy (STM) study on samples with various compositions and doping conditions. The system is equipped with a UHV sample preparation chamber and mounted on a two-stage vibration isolation system made of a heavy concrete block and a granite table on pneumatic vibration isolators. A quartz resonator (qPlus)-based non-contact atomic force microscope (AFM) sensor is used for simultaneous STM/AFM operation for research on samples with highly insulating properties such as strongly underdoped cuprates and strongly correlated electron systems.

  19. High throughput, parallel scanning probe microscope for nanometrology and nanopatterning applications

    NARCIS (Netherlands)

    Sadeghian Marnani, H.; Paul, P.C.; Herfst, R.W.; Dekker, A.; Winters, J.; Maturova, K.

    2017-01-01

    Scanning Probe microscope (SPM) is an important nanoinstrument for several applications such as bioresearch, metrology, inspection and nanopatterning. Single SPM is associated with relatively slow rate of scanning and low throughput measurement, thus not being suitable for scanning large samples

  20. Apoptosis study of the macrophage via near-field scanning optical microscope

    International Nuclear Information System (INIS)

    Wang, D-C; Chen, K-Y; Chen, G-Y; Chen, S-H; Wun, S-J

    2008-01-01

    The cell apoptosis phenomenon was studied by traditional optical microscope with much lower resolution and also observed by Atomic Force Microscope (AFM) with nano-resolution recently. They both detect the cell apoptosis through the change of cell topography. In this study, the cell apoptosis was investigated via Near-Field Scanning Optical Microscope (NSOM). The cell topography, with nano-scaled resolution, and its optical characteristics were observed by NSOM at the same measurement scanning. The macrophage was chosen as the cell investigated. To understand the cell apoptosis process is the goal set for the research. The apoptosis process was related to the variations of the optical characteristics of the cell

  1. Scanning SQUID microscope with an in-situ magnetization/demagnetization field for geological samples

    Science.gov (United States)

    Du, Junwei; Liu, Xiaohong; Qin, Huafeng; Wei, Zhao; Kong, Xiangyang; Liu, Qingsong; Song, Tao

    2018-04-01

    Magnetic properties of rocks are crucial for paleo-, rock-, environmental-magnetism, and magnetic material sciences. Conventional rock magnetometers deal with bulk properties of samples, whereas scanning microscope can map the distribution of remanent magnetization. In this study, a new scanning microscope based on a low-temperature DC superconducting quantum interference device (SQUID) equipped with an in-situ magnetization/demagnetization device was developed. To realize the combination of sensitive instrument as SQUID with high magnetizing/demagnetizing fields, the pick-up coil, the magnetization/demagnetization coils and the measurement mode of the system were optimized. The new microscope has a field sensitivity of 250 pT/√Hz at a coil-to-sample spacing of ∼350 μm, and high magnetization (0-1 T)/ demagnetization (0-300 mT, 400 Hz) functions. With this microscope, isothermal remanent magnetization (IRM) acquisition and the according alternating field (AF) demagnetization curves can be obtained for each point without transferring samples between different procedures, which could result in position deviation, waste of time, and other interferences. The newly-designed SQUID microscope, thus, can be used to investigate the rock magnetic properties of samples at a micro-area scale, and has a great potential to be an efficient tool in paleomagnetism, rock magnetism, and magnetic material studies.

  2. A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions

    DEFF Research Database (Denmark)

    Holm, Jesper; Mygind, Jesper

    1995-01-01

    to a very localized heating induced by irradiation with 675 nm wavelength light from a semiconductor laser. The hot spot is moved by a specially designed piezoelectric scanner sweeping the tip of a single-mode optical fiber a few µm above the circuit. Depending on the scanner design the scanning area can...... be as large as 50×500 µm2 at 4.2 K. The microscope can be operated in the temperature range 2–300 K using a standard temperature controller. The central microscope body is mounted inside the vacuum can of a dip-stick-type cryoprobe. A damped spring system is used to reduce interference from extraneous...

  3. Lateral resolution testing of a novel developed confocal microscopic imaging system

    Science.gov (United States)

    Zhang, Xin; Zhang, Yunhai; Chang, Jian; Huang, Wei; Xue, Xiaojun; Xiao, Yun

    2015-10-01

    Laser scanning confocal microscope has been widely used in biology, medicine and material science owing to its advantages of high resolution and tomographic imaging. Based on a set of confirmatory experiments and system design, a novel confocal microscopic imaging system is developed. The system is composed of a conventional fluorescence microscope and a confocal scanning unit. In the scanning unit a laser beam coupling module provides four different wavelengths 405nm 488nm 561nm and 638nm which can excite a variety of dyes. The system works in spot-to-spot scanning mode with a two-dimensional galvanometer. A 50 microns pinhole is used to guarantee that stray light is blocked and only the fluorescence signal from the focal point can be received . The three-channel spectral splitter is used to perform fluorescence imaging at three different working wavelengths simultaneously. The rat kidney tissue slice is imaged using the developed confocal microscopic imaging system. Nucleues labeled by DAPI and kidney spherule curved pipe labeled by Alexa Fluor 488 can be imaged clearly and respectively, realizing the distinction between the different components of mouse kidney tissue. The three-dimensional tomographic imaging of mouse kidney tissue is reconstructed by several two-dimensional images obtained in different depths. At last the resolution of the confocal microscopic imaging system is tested quantitatively. The experimental result shows that the system can achieve lateral resolution priority to 230nm.

  4. Status of automated nuclear scanning systems

    International Nuclear Information System (INIS)

    Gold, R.; Roberts, J.H.; Preston, C.C.; McNeece, J.P.; Ruddy, F.H.

    1983-07-01

    Present day minicomputers and microprocessors enable a range of automation, from partial to total, of tasks once thought beyond approach. The status of three computer controlled systems for quantitative track measurements is reviewed. Two systems, the Hanford optical track scanner (HOTS) and an automated scanning electron microscope (ASEM) are used for scanning solid state track recorders (SSTR). The third systems, the emulsion scanning processor (ESP), is an interactive system used to measure the length of proton tracks in nuclear research emulsions (NRE). Current limitations of these systems for quantitative track scanning are presented. Experimental uncertainties attained with these computer controlled systems are described using results obtained from reactor neutron dosimetry

  5. Four-probe measurements with a three-probe scanning tunneling microscope

    International Nuclear Information System (INIS)

    Salomons, Mark; Martins, Bruno V. C.; Zikovsky, Janik; Wolkow, Robert A.

    2014-01-01

    We present an ultrahigh vacuum (UHV) three-probe scanning tunneling microscope in which each probe is capable of atomic resolution. A UHV JEOL scanning electron microscope aids in the placement of the probes on the sample. The machine also has a field ion microscope to clean, atomically image, and shape the probe tips. The machine uses bare conductive samples and tips with a homebuilt set of pliers for heating and loading. Automated feedback controlled tip-surface contacts allow for electrical stability and reproducibility while also greatly reducing tip and surface damage due to contact formation. The ability to register inter-tip position by imaging of a single surface feature by multiple tips is demonstrated. Four-probe material characterization is achieved by deploying two tips as fixed current probes and the third tip as a movable voltage probe

  6. Four-probe measurements with a three-probe scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Salomons, Mark [National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta T6G 2M9 (Canada); Martins, Bruno V. C.; Zikovsky, Janik; Wolkow, Robert A., E-mail: rwolkow@ualberta.ca [National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta T6G 2M9 (Canada); Department of Physics, University of Alberta, Edmonton, Alberta T6G 2E1 (Canada)

    2014-04-15

    We present an ultrahigh vacuum (UHV) three-probe scanning tunneling microscope in which each probe is capable of atomic resolution. A UHV JEOL scanning electron microscope aids in the placement of the probes on the sample. The machine also has a field ion microscope to clean, atomically image, and shape the probe tips. The machine uses bare conductive samples and tips with a homebuilt set of pliers for heating and loading. Automated feedback controlled tip-surface contacts allow for electrical stability and reproducibility while also greatly reducing tip and surface damage due to contact formation. The ability to register inter-tip position by imaging of a single surface feature by multiple tips is demonstrated. Four-probe material characterization is achieved by deploying two tips as fixed current probes and the third tip as a movable voltage probe.

  7. Four-probe measurements with a three-probe scanning tunneling microscope.

    Science.gov (United States)

    Salomons, Mark; Martins, Bruno V C; Zikovsky, Janik; Wolkow, Robert A

    2014-04-01

    We present an ultrahigh vacuum (UHV) three-probe scanning tunneling microscope in which each probe is capable of atomic resolution. A UHV JEOL scanning electron microscope aids in the placement of the probes on the sample. The machine also has a field ion microscope to clean, atomically image, and shape the probe tips. The machine uses bare conductive samples and tips with a homebuilt set of pliers for heating and loading. Automated feedback controlled tip-surface contacts allow for electrical stability and reproducibility while also greatly reducing tip and surface damage due to contact formation. The ability to register inter-tip position by imaging of a single surface feature by multiple tips is demonstrated. Four-probe material characterization is achieved by deploying two tips as fixed current probes and the third tip as a movable voltage probe.

  8. The Development of a Scanning Soft X-Ray Microscope.

    Science.gov (United States)

    Rarback, Harvey Miles

    We have developed a scanning soft X-ray microscope, which can be used to image natural biological specimens at high resolution and with less damage than electron microscopy. The microscope focuses a monochromatic beam of synchrotron radiation to a nearly diffraction limited spot with the aid of a high resolution Fresnel zone plate, specially fabricated for us at the IBM Watson Research Center. The specimen at one atmosphere is mechanically scanned through the spot and the transmitted radiation is efficiently detected with a flow proportional counter. A computer forms a realtime transmission image of the specimen which is displayed on a color monitor. Our first generation optics have produced images of natural wet specimens at a resolution of 300 nm.

  9. Compact scanning tunneling microscope for spin polarization measurements.

    Science.gov (United States)

    Kim, Seong Heon; de Lozanne, Alex

    2012-10-01

    We present a design for a scanning tunneling microscope that operates in ultrahigh vacuum down to liquid helium temperatures in magnetic fields up to 8 T. The main design philosophy is to keep everything compact in order to minimize the consumption of cryogens for initial cool-down and for extended operation. In order to achieve this, new ideas were implemented in the design of the microscope body, dewars, vacuum chamber, manipulators, support frame, and vibration isolation. After a brief description of these designs, the results of initial tests are presented.

  10. An ultrahigh vacuum fast-scanning and variable temperature scanning tunneling microscope for large scale imaging.

    Science.gov (United States)

    Diaconescu, Bogdan; Nenchev, Georgi; de la Figuera, Juan; Pohl, Karsten

    2007-10-01

    We describe the design and performance of a fast-scanning, variable temperature scanning tunneling microscope (STM) operating from 80 to 700 K in ultrahigh vacuum (UHV), which routinely achieves large scale atomically resolved imaging of compact metallic surfaces. An efficient in-vacuum vibration isolation and cryogenic system allows for no external vibration isolation of the UHV chamber. The design of the sample holder and STM head permits imaging of the same nanometer-size area of the sample before and after sample preparation outside the STM base. Refractory metal samples are frequently annealed up to 2000 K and their cooldown time from room temperature to 80 K is 15 min. The vertical resolution of the instrument was found to be about 2 pm at room temperature. The coarse motor design allows both translation and rotation of the scanner tube. The total scanning area is about 8 x 8 microm(2). The sample temperature can be adjusted by a few tens of degrees while scanning over the same sample area.

  11. Design and performance of the 2-ID-B scanning x-ray microscope

    International Nuclear Information System (INIS)

    McNulty, I.

    1998-01-01

    We have constructed a high resolution scanning x-ray microscope at the 2-ID-B beamline at the Advanced Photon Source for 1-4 keV x-ray imaging and microspectroscopy experiments. The microscope uses a Fresnel zone plate to focus coherent x-ray undulator radiation to a 150 nm focal spot on a sample. The spectral flux in the focus is 10 8 ph/s/0.1% BW. X-ray photons transmitted by the sample are detected by an avalanche photodiode as the sample is scanned to form an absorption image. The sample stage has both coarse and fine translation axes for raster scanning and a rotation axis for microtomography experiments. The incident x-ray beam energy can also be scanned via the 2-ID-B monochromator while the sample is kept in focus to record spatially resolved absorption spectra. We have measured the performance of the instrument with various test objects. The microscope hardware, software, and performance are discussed in this paper

  12. Compact scanning transmission x-ray microscope at the photon factory

    International Nuclear Information System (INIS)

    Takeichi, Yasuo; Inami, Nobuhito; Ono, Kanta; Suga, Hiroki; Takahashi, Yoshio

    2016-01-01

    We report the design and performance of a compact scanning transmission X-ray microscope developed at the Photon Factory. Piezo-driven linear stages are used as coarse stages of the microscope to realize excellent compactness, mobility, and vibrational and thermal stability. An X-ray beam with an intensity of ∼10 7 photons/s was focused to a diameter of ∼40 nm at the sample. At the soft X-ray undulator beamline used with the microscope, a wide range of photon energies (250–1600 eV) is available. The microscope has been used to research energy materials and in environmental sciences

  13. Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

    International Nuclear Information System (INIS)

    Behan, G; Nellist, P D

    2008-01-01

    The use of spherical aberration correctors in the scanning transmission electron microscope (STEM) has the effect of reducing the depth of field of the microscope, making three-dimensional imaging of a specimen possible by optical sectioning. Depth resolution can be improved further by placing aberration correctors and lenses pre and post specimen to achieve an imaging mode known as scanning confocal electron microscopy (SCEM). We present the calculated incoherent point spread functions (PSF) and optical transfer functions (OTF) of a STEM and SCEM. The OTF for a STEM is shown to have a missing cone region which results in severe blurring along the optic axis, which can be especially severe for extended objects. We also present strategies for reconstruction of experimental data, such as three-dimensional deconvolution of the point spread function.

  14. Scanning electron microscope autoradiography of critical point dried biological samples

    International Nuclear Information System (INIS)

    Weiss, R.L.

    1980-01-01

    A technique has been developed for the localization of isotopes in the scanning electron microscope. Autoradiographic studies have been performed using a model system and a unicellular biflagellate alga. One requirement of this technique is that all manipulations be carried out on samples that are maintained in a liquid state. Observations of a source of radiation ( 125 I-ferritin) show that the nuclear emulsion used to detect radiation is active under these conditions. Efficiency measurement performed using 125 I-ferritin indicate that 125 I-SEM autoradiography is an efficient process that exhibits a 'dose dependent' response. Two types of labeling methods were used with cells, surface labeling with 125 I and internal labeling with 3 H. Silver grains appeared on labeled cells after autoradiography, removal of residual gelatin and critical point drying. The location of grains was examined on a flagellated green alga (Chlamydomonas reinhardi) capable of undergoing cell fusion. Fusion experiments using labeled and unlabeled cells indicate that 1. Labeling is specific for incorporated radioactivity; 2. Cell surface structure is preserved in SEM autoradiographs and 3. The technique appears to produce reliable autoradiographs. Thus scanning electron microscope autoradiography should provide a new and useful experimental approach

  15. Study of Scanning Tunneling Microscope control electronics

    International Nuclear Information System (INIS)

    Oliva, A.J.; Pancarobo, M.; Denisenko, N.; Aguilar, M.; Rejon, V.; Pena, J.L.

    1994-01-01

    A theoretical study of Scanning Tunneling Microscope control electronics is made. The knowledge of its behaviour allows us to determine accurately the region where the unstable operation could effect the measurements, and also to set the optimal working parameters. Each feedback circuitry compound is discussed as well as their mutual interaction. Different working conditions analysis and results are presented. (Author) 12 refs

  16. Digital acquisition and processing of electron micrographs using a scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Engel, A.; Christen, F.; Michel, B.

    1981-01-01

    A digital acquisition system that collects multichannel information from a scanning transmission electron microscope (STEM) and its application are described. The hardware comprises (i) single electron counting detectors, (ii) a digital scan generator, (iii) a digital multi-channel on-line processor, (iv) an interface to a minicomputer, and (v) a display system. Experimental results characterizing these components are presented, and their performance is discussed. The software includes assembler coded programs for dynamic file maintenance and fast acquisition of image data, a display driver, and FORTRAN coded application programs. The usefulness of digitized STEM is illustrated by a variety of biological applications. (orig.)

  17. Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates.

    Science.gov (United States)

    Zhang, Hao; Li, Xianqi; Chen, Yunmei; Park, Jewook; Li, An-Ping; Zhang, X-G

    2017-01-01

    We present an image postprocessing framework for Scanning Tunneling Microscope (STM) to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a "rubber band" model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA). The numerical results on measurement from copper(111) surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.

  18. Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates

    Directory of Open Access Journals (Sweden)

    Hao Zhang

    2017-01-01

    Full Text Available We present an image postprocessing framework for Scanning Tunneling Microscope (STM to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a “rubber band” model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA. The numerical results on measurement from copper(111 surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.

  19. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

    International Nuclear Information System (INIS)

    Steurer, Wolfram; Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard

    2014-01-01

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K

  20. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Steurer, Wolfram, E-mail: wst@zurich.ibm.com; Gross, Leo; Schlittler, Reto R.; Meyer, Gerhard [IBM Research-Zurich, 8803 Rüschlikon (Switzerland)

    2014-02-15

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

  1. A variable-temperature nanostencil compatible with a low-temperature scanning tunneling microscope/atomic force microscope.

    Science.gov (United States)

    Steurer, Wolfram; Gross, Leo; Schlittler, Reto R; Meyer, Gerhard

    2014-02-01

    We describe a nanostencil lithography tool capable of operating at variable temperatures down to 30 K. The setup is compatible with a combined low-temperature scanning tunneling microscope/atomic force microscope located within the same ultra-high-vacuum apparatus. The lateral movement capability of the mask allows the patterning of complex structures. To demonstrate operational functionality of the tool and estimate temperature drift and blurring, we fabricated LiF and NaCl nanostructures on Cu(111) at 77 K.

  2. New design of a variable-temperature ultrahigh vacuum scanning tunneling microscope

    NARCIS (Netherlands)

    Mugele, Friedrich Gunther; Rettenberger, A.; Boneberg, J.; Leiderer, P.

    1998-01-01

    We present the design of a variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope which can be operated between 20 and 400 K. The microscope is mounted directly onto the heat exchanger of a He continuous flow cryostat without vibration isolation inside the UHV chamber. The coarse

  3. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

    International Nuclear Information System (INIS)

    Higuchi, Seiji; Kubo, Osamu; Kuramochi, Hiromi; Aono, Masakazu; Nakayama, Tomonobu

    2011-01-01

    Four-terminal electrical measurement is realized on a microscopic structure in air, without a lithographic process, using a home-built quadruple-scanning-probe force microscope (QSPFM). The QSPFM has four probes whose positions are individually controlled by obtaining images of a sample in the manner of atomic force microscopy (AFM), and uses the probes as contacting electrodes for electrical measurements. A specially arranged tuning fork probe (TFP) is used as a self-detection force sensor to operate each probe in a frequency modulation AFM mode, resulting in simultaneous imaging of the same microscopic feature on an insulator using the four TFPs. Four-terminal electrical measurement is then demonstrated in air by placing each probe electrode in contact with a graphene flake exfoliated on a silicon dioxide film, and the sheet resistance of the flake is measured by the van der Pauw method. The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.

  4. Permanent magnet finger-size scanning electron microscope columns

    Energy Technology Data Exchange (ETDEWEB)

    Nelliyan, K., E-mail: elenk@nus.edu.sg [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore); Khursheed, A. [Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576 (Singapore)

    2011-07-21

    This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

  5. Permanent magnet finger-size scanning electron microscope columns

    International Nuclear Information System (INIS)

    Nelliyan, K.; Khursheed, A.

    2011-01-01

    This paper presents permanent magnet scanning electron microscope (SEM) designs for both tungsten and field emission guns. Each column makes use of permanent magnet technology and operates at a fixed primary beam voltage. A prototype column operating at a beam voltage of 15 kV was made and tested inside the specimen chamber of a conventional SEM. A small electrostatic stigmator unit and dedicated scanning coils were integrated into the column. The scan coils were wound directly around the objective lens iron core in order to reduce its size. Preliminary experimental images of a test grid specimen were obtained through the prototype finger-size column, demonstrating that it is in principle feasible.

  6. Ionic channels in Langmuir-Blodgett films imaged by a scanning tunneling microscope.

    Science.gov (United States)

    Kolomytkin, O V; Golubok, A O; Davydov, D N; Timofeev, V A; Vinogradova, S A; Tipisev SYa

    1991-01-01

    The molecular structure of channels formed by gramicidin A in a lipid membrane was imaged by a scanning tunneling microscope operating in air. The mono- and bimolecular films of lipid with gramicidin A were deposited onto a highly oriented pyrolitic graphite substrate by the Langmuir-Blodgett technique. It has been shown that under high concentration gramicidin A molecules can form in lipid films a quasi-regular, densely packed structure. Single gramicidin A molecules were imaged for the first time as well. The cavity of 0.4 +/- 0.05 nm in halfwidth was found on the scanning tunneling microscopy image of the gramicidin A molecule. The results of direct observation obtained by means of scanning tunneling microscope are in good agreement with the known molecular model of gramicidin A. It was shown that gramicidin A molecules can exist in a lipid monolayer as individual molecules or combined into clusters. The results demonstrate that scanning tunneling microscope can be used for high spatial resolution study of ionic channel structure. Images FIGURE 1 FIGURE 2 FIGURE 4 FIGURE 5 PMID:1712239

  7. Superconducting phonon spectroscopy using a low-temperature scanning tunneling microscope

    Science.gov (United States)

    Leduc, H. G.; Kaiser, W. J.; Hunt, B. D.; Bell, L. D.; Jaklevic, R. C.

    1989-01-01

    The low-temperature scanning tunneling microscope (STM) system described by LeDuc et al. (1987) was used to observe the phonon density of states effects in a superconductor. Using techniques based on those employed in macroscopic tunneling spectroscopy, electron tunneling current-voltage (I-V) spectra were measured for NbN and Pb, and dI/dV vs V spectra were measured using standard analog derivative techniques. I-V measurements on NbN and Pb samples under typical STM conditions showed no evidence for multiparticle tunneling effects.

  8. Quantitative characterization of semiconductor structures with a scanning microwave microscope.

    Science.gov (United States)

    Korolyov, S A; Reznik, A N

    2018-02-01

    In this work, our earlier method for measuring resistance R sh of semiconductor films with a near-field scanning microwave microscope [A. N. Reznik and S. A. Korolyov, J. Appl. Phys. 119, 094504 (2016)] is studied in a 0.1 kΩ/sq microscope model in the form of a monopole or dipole antenna interacting with an arbitrary layered structure. The model fitting parameters are determined from the data yielded by calibration measurements on a system of etalon samples. The performance of the method was analyzed experimentally, using strip-probe and coaxial-probe microscopes in the frequency range of 1-3 GHz. For test structures, we used doped GaN films on the Al 2 O 3 substrate and also transistor structures based on the AlGaN/GaN heterojunction and AlGaAs/GaAs/InGaAs/GaAs/AlGaAs quantum well with a conducting channel. The obtained microwave microscope data were compared with the results of measurements by the van der Pauw method. At the first stage of the experiment, the calibration etalons were bulk homogeneous samples with different permittivity/conductivity values. In this case, satisfactory agreement between the microscope and the van der Pauw data was obtained with a strip probe on all tested samples in the entire range of R sh . With a coaxial probe, such accordance was observed only in high-ohmic samples with R sh > 1 kΩ/sq. The use of GaN film structures as a calibration system helped to increase the accuracy of the coaxial-probe-aided measurement of R sh to a level of ∼10%.

  9. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans.

    Science.gov (United States)

    Chen, Xu; Guo, Tengfei; Hou, Yubin; Zhang, Jing; Meng, Wenjie; Lu, Qingyou

    2017-01-01

    A new scan-head structure for the scanning tunneling microscope (STM) is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for XY scans) coaxially housed in a piezoelectric tube with single inner and outer electrodes (for Z scan). They are fixed at one end (called common end). A hollow tantalum shaft is coaxially housed in the XY -scan tube and they are mutually fixed at both ends. When the XY scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled XY and Z scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.

  10. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans

    Directory of Open Access Journals (Sweden)

    Xu Chen

    2017-01-01

    Full Text Available A new scan-head structure for the scanning tunneling microscope (STM is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for XY scans coaxially housed in a piezoelectric tube with single inner and outer electrodes (for Z scan. They are fixed at one end (called common end. A hollow tantalum shaft is coaxially housed in the XY-scan tube and they are mutually fixed at both ends. When the XY scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled XY and Z scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.

  11. Atomic physics with the scanning tunneling microscope

    International Nuclear Information System (INIS)

    Kleber, M.; Bracher, C.; Riza, M.

    1999-01-01

    Backscattering of atomic beams above a given surface yields information similar to the one obtained from scanning the same surface with a scanning tunneling microscope (STM): In both cases the experimentally accessible quantity is the local density of states (LDOS) n(r,E) of the surface. For the case of backscattering, the LDOS at the turning point of the atom is an important ingredient of the potential between atom and surface. In experiments performed with an STM, the LDOS at the apex of an atomically sharp tip can be determined directly. Probing surfaces locally by an STM allows for the study of basic phenomena in atomic physics, with tunneling of electrons in three dimensions being a central issue

  12. High-voltage scanning ion microscope: Beam optics and design

    Energy Technology Data Exchange (ETDEWEB)

    Magilin, D., E-mail: dmitrymagilin@gmail.com; Ponomarev, A.; Rebrov, V.; Ponomarov, A.

    2015-05-01

    This article is devoted to the conceptual design of a compact high-voltage scanning ion microscope (HVSIM). In an HVSIM design, the ion optical system is based on a high-brightness ion source. Specifically, the ion optical system is divided into two components: an ion injector and a probe-forming system (PFS) that consists of an accelerating tube and a multiplet of quadrupole lenses. The crossover is formed and controlled by the injector, which acts as an object collimator, and is focused on the image plane by the PFS. The ion microprobe has a size of 0.1 μm and an energy of 2 MeV. When the influence of the chromatic and third-order aberrations is theoretically taken into account, the HVSIM forms an ion microprobe.

  13. 3-d chemical imaging using angle-scan nanotomography in a soft X-ray scanning transmission X-ray microscope

    Energy Technology Data Exchange (ETDEWEB)

    Hitchcock, A.P.; Johansson, G.A. [McMaster, BIMR, Hamilton (Canada); Mitchell, G.E. [Dow Chemical, Analytical Science, Midland, MI (United States); Keefe, M.H. [Dow Chemical, Dow Latex, Midland, MI (United States); Tyliszcak, T. [LBNL, Advanced Light Source, Berkeley, CA (United States)

    2008-08-15

    Three-dimensional chemical mapping using angle scan nanotomography in a soft X-ray scanning transmission X-ray microscope (STXM) has been used to investigate the spatial distributions of a low density polyacrylate polyelectrolyte ionomer inside submicron sized polystyrene microspheres. Acquisition of tomograms at multiple photon energies provides true, quantifiable 3-d chemical sensitivity. Both pre-O 1s and C 1s results are shown. The study reveals aspects of the 3-d distribution of the polyelectrolyte that were inferred indirectly or had not been known prior to this study. The potential and challenges for extension of the technique to studies of other polymeric and to biological systems is discussed. (orig.)

  14. Microsphere-based super-resolution scanning optical microscope.

    Science.gov (United States)

    Huszka, Gergely; Yang, Hui; Gijs, Martin A M

    2017-06-26

    High-refractive index dielectric microspheres positioned within the field of view of a microscope objective in a dielectric medium can focus the light into a so-called photonic nanojet. A sample placed in such nanojet can be imaged by the objective with super-resolution, i.e. with a resolution beyond the classical diffraction limit. However, when imaging nanostructures on a substrate, the propagation distance of a light wave in the dielectric medium in between the substrate and the microsphere must be small enough to reveal the sample's nanometric features. Therefore, only the central part of an image obtained through a microsphere shows super-resolution details, which are typically ∼100 nm using white light (peak at λ = 600 nm). We have performed finite element simulations of the role of this critical distance in the super-resolution effect. Super-resolution imaging of a sample placed beneath the microsphere is only possible within a very restricted central area of ∼10 μm 2 , where the separation distance between the substrate and the microsphere surface is very small (∼1 μm). To generate super-resolution images over larger areas of the sample, we have fixed a microsphere on a frame attached to the microscope objective, which is automatically scanned over the sample in a step-by-step fashion. This generates a set of image tiles, which are subsequently stitched into a single super-resolution image (with resolution of λ/4-λ/5) of a sample area of up to ∼10 4 μm 2 . Scanning a standard optical microscope objective with microsphere therefore enables super-resolution microscopy over the complete field-of-view of the objective.

  15. Regular Scanning Tunneling Microscope Tips can be Intrinsically Chiral

    International Nuclear Information System (INIS)

    Tierney, Heather L.; Murphy, Colin J.; Sykes, E. Charles H.

    2011-01-01

    We report our discovery that regular scanning tunneling microscope tips can themselves be chiral. This chirality leads to differences in electron tunneling efficiencies through left- and right-handed molecules, and, when using the tip to electrically excite molecular rotation, large differences in rotation rate were observed which correlated with molecular chirality. As scanning tunneling microscopy is a widely used technique, this result may have unforeseen consequences for the measurement of asymmetric surface phenomena in a variety of important fields.

  16. Regular scanning tunneling microscope tips can be intrinsically chiral.

    Science.gov (United States)

    Tierney, Heather L; Murphy, Colin J; Sykes, E Charles H

    2011-01-07

    We report our discovery that regular scanning tunneling microscope tips can themselves be chiral. This chirality leads to differences in electron tunneling efficiencies through left- and right-handed molecules, and, when using the tip to electrically excite molecular rotation, large differences in rotation rate were observed which correlated with molecular chirality. As scanning tunneling microscopy is a widely used technique, this result may have unforeseen consequences for the measurement of asymmetric surface phenomena in a variety of important fields.

  17. Solving Research Tasks Using Desk top Scanning Electron Microscope Phenom ProX

    Directory of Open Access Journals (Sweden)

    Vertsanova, O.V.

    2014-03-01

    Full Text Available Phenom ProX — morden effective universal desktop Scanning Electron Microscope with integrated EDS system. Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

  18. Dark-field scanning confocal microscope for vertical particle tracks in nuclear emulsion

    International Nuclear Information System (INIS)

    Astakhov, A.Ya.; Batusov, Yu.A.; Soroko, L.M.; Tereshchenko, S.V.; Tereshchenko, V.V.

    1999-01-01

    The principle of the DArk-FIeld Scanning CONfocal (DAFISCON) microscope for selective observation of the vertical particle tracks in nuclear emulsion is described. The construction of the DAFISCON microscope, built on the basis of the 2D measurement microscope, is described. The results of the experimental testing of the DAFISCON microscope, accomplished at high density of the vertical particle tracks, are presented. The 2D plot and the 1D plot of the CCD dark-field image are given. The spatial resolution of our microscope can be increased by using the objective with higher aperture

  19. Single-atom contacts with a scanning tunnelling microscope

    International Nuclear Information System (INIS)

    Kroeger, J; Neel, N; Sperl, A; Wang, Y F; Berndt, R

    2009-01-01

    The tip of a cryogenic scanning tunnelling microscope is used to controllably contact single atoms adsorbed on metal surfaces. The transition between tunnelling and contact is gradual for silver, while contact to adsorbed gold atoms is abrupt. The single-atom junctions are stable and enable spectroscopic measurements of, e.g., the Abrikosov-Suhl resonance of single Kondo impurities.

  20. Microscopic image processing system for measuring nonuniform film thickness profiles: Image scanning ellipsometry

    International Nuclear Information System (INIS)

    Liu, A.H.; Plawsky, J.L.; Wayner, P.C. Jr.

    1993-01-01

    The long-term objective of this research program is to determine the stability and heat transfer characteristics of evaporating thin films. The current objective is to develop and use a microscopic image-processing system (IPS) which has two parts: an image analyzing interferometer (IAI) and an image scanning ellipsometer (ISE). The primary purpose of this paper is to present the basic concept of ISE, which is a novel technique to measure the two dimensional thickness profile of a non-uniform, thin film, from several nm up to several μm, in a steady state as well as in a transient state. It is a full-field imaging technique which can study every point on the surface simultaneously with high spatial resolution and thickness sensitivity, i.e., it can measure and map the 2-D film thickness profile. The ISE was tested by measuring the thickness profile and the refractive index of a nonuniform solid film

  1. Theoretical approach to the scanning tunneling microscope

    International Nuclear Information System (INIS)

    Noguera, C.

    1990-01-01

    Within a one-electron approach, based on a Green's-function formalism, a nonperturbative expression for the tunneling current is obtained and used to discuss which spectroscopic information may be deduced from a scanning-tunneling-microscope experiment. It is shown up to which limits the voltage dependence of the tunneling current reproduces the local density of states at the surface, and how the reflection coefficients of the electronic waves at the surface may modify it

  2. A portable confocal hyperspectral microscope without any scan or tube lens and its application in fluorescence and Raman spectral imaging

    Science.gov (United States)

    Li, Jingwei; Cai, Fuhong; Dong, Yongjiang; Zhu, Zhenfeng; Sun, Xianhe; Zhang, Hequn; He, Sailing

    2017-06-01

    In this study, a portable confocal hyperspectral microscope is developed. In traditional confocal laser scanning microscopes, scan lens and tube lens are utilized to achieve a conjugate relationship between the galvanometer and the back focal plane of the objective, in order to achieve a better resolution. However, these lenses make it difficult to scale down the volume of the system. In our portable confocal hyperspectral microscope (PCHM), the objective is placed directly next to the galvomirror. Thus, scan lens and tube lens are not included in our system and the size of this system is greatly reduced. Furthermore, the resolution is also acceptable in many biomedical and food-safety applications. Through reducing the optical length of the system, the signal detection efficiency is enhanced. This is conducive to realizing both the fluorescence and Raman hyperspectral imaging. With a multimode fiber as a pinhole, an improved image contrast is also achieved. Fluorescent spectral images for HeLa cells/fingers and Raman spectral images of kumquat pericarp are present. The spectral resolution and spatial resolutions are about 0.4 nm and 2.19 μm, respectively. These results demonstrate that this portable hyperspectral microscope can be used in in-vivo fluorescence imaging and in situ Raman spectral imaging.

  3. Near-field optical microscopy with a scanning tunneling microscope

    International Nuclear Information System (INIS)

    Barbara, A.; Lopez-Rios, T.; Quemerais, P.

    2005-01-01

    A homemade apertureless near-field optical microscope using a scanning tunneling microscope (STM) is described. The experimental set-up simultaneously provides optical and topographic images of the sample. Technical details and features of the set-up are presented, together with results demonstrating the sub-wavelength resolution achieved as well as its sensitivity to dielectric contrasts. We show that the use of a STM permits to precisely control very small distances between the tip and the sample which is a great advantage to excite localized optical resonances between the tip and the surface

  4. A new clustering algorithm for scanning electron microscope images

    Science.gov (United States)

    Yousef, Amr; Duraisamy, Prakash; Karim, Mohammad

    2016-04-01

    A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with the sample atoms, producing various signals that are collected by detectors. The gathered signals contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. The most common configuration for an SEM produces a single value per pixel, with the results usually rendered as grayscale images. The captured images may be produced with insufficient brightness, anomalous contrast, jagged edges, and poor quality due to low signal-to-noise ratio, grained topography and poor surface details. The segmentation of the SEM images is a tackling problems in the presence of the previously mentioned distortions. In this paper, we are stressing on the clustering of these type of images. In that sense, we evaluate the performance of the well-known unsupervised clustering and classification techniques such as connectivity based clustering (hierarchical clustering), centroid-based clustering, distribution-based clustering and density-based clustering. Furthermore, we propose a new spatial fuzzy clustering technique that works efficiently on this type of images and compare its results against these regular techniques in terms of clustering validation metrics.

  5. Development of the tunneling junction simulation environment for scanning tunneling microscope evaluation

    International Nuclear Information System (INIS)

    Gajewski, Krzysztof; Piasecki, Tomasz; Kopiec, Daniel; Gotszalk, Teodor

    2017-01-01

    Proper configuration of scanning tunneling microscope electronics plays an important role in the atomic scale resolution surface imaging. Device evaluation in the tunneling contact between scanning tip and sample may be prone to the surface quality or mechanical disturbances. Thus the use of tunneling junction simulator makes electronics testing more reliable and increases its repeatability. Here, we present the theoretical background enabling the proper selection of electronic components circuitry used as a tunneling junction simulator. We also show how to simulate mechanics related to the piezoelectric scanner, which is applied in real experiments. Practical use of the proposed simulator and its application in metrological characterization of the developed scanning tunneling microscope is also shown. (paper)

  6. Scanning electron microscope - some aspects of the instrument and its applications

    International Nuclear Information System (INIS)

    Thatte, M.R.

    1976-01-01

    Development of the science of microscopy leading to three different types of microscopes - the optical, the conventional transmission electron microscope (CTEM) and the scanning electron microscope(SEM) has been discussed. Special advantages of the SEM in the solution of problems in industrial laboratories are mentioned. A brief reference to the latest instruments announced by Siemens AG shows the modern trends in the technique. A close similarity in image building between SEM and television is indicated. Operational anatomy of the SEM is reviewed. (author)

  7. Computer controlled scanning systems for quantitative track measurements

    International Nuclear Information System (INIS)

    Gold, R.; Roberts, J.H.; Preston, C.C.; Ruddy, F.H.

    1982-01-01

    The status of three computer cntrolled systems for quantitative track measurements is described. Two systems, an automated optical track scanner (AOTS) and an automated scanning electron microscope (ASEM) are used for scanning solid state track recorders (SSTR). The third system, the emulsion scanning processor (ESP), is an interactive system used to measure the length of proton tracks in nuclear research emulsions (NRE). Recent advances achieved with these systems are presented, with emphasis placed upon the current limitation of these systems for reactor neutron dosimetry

  8. Helium leak testing of scanning electron microscope

    International Nuclear Information System (INIS)

    Ahmad, Anis; Tripathi, S.K.; Mukherjee, D.

    2015-01-01

    Scanning Electron Microscope (SEM) is a specialized electron-optical device which is used for imaging of miniscule features on topography of material specimens. Conventional SEMs used finely focused high energy (about 30 KeV) electron beam probes of diameter of about 10nm for imaging of solid conducting specimens. Vacuum of the order of 10"-"5 Torr is prerequisite for conventional Tungsten filament type SEMs. One such SEM was received from one of our laboratory in BARC with a major leak owing to persisting poor vacuum condition despite continuous pumping for several hours. He-Leak Detection of the SEM was carried out at AFD using vacuum spray Technique and various potential leak joints numbering more than fifty were helium leak tested. The major leak was detected in the TMP damper bellow. The part was later replaced and the repeat helium leak testing of the system was carried out using vacuum spray technique. The vacuum in SEM is achieved is better than 10"-"5 torr and system is now working satisfactorily. (author)

  9. New Scanning Electron Microscope Used for Cryogenic Tensile Testing

    CERN Multimedia

    Maximilien Brice

    2013-01-01

    At CERN engineering department's installation for cryogenic tensile testing, the new scanning electron microscope (SEM) allows for detailed optical observations to be carried out. Using the SEM, surface coatings and tensile properties of materials can investigated in order to better understand how they behave under different conditions.

  10. Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices.

    Science.gov (United States)

    Park, Kyoung-Duck; Jeong, Hyun; Kim, Yong Hwan; Yim, Sang-Youp; Lee, Hong Seok; Suh, Eun-Kyung; Jeong, Mun Seok

    2013-03-01

    We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.

  11. Quantitative measurement of piezoelectric coefficient of thin film using a scanning evanescent microwave microscope.

    Science.gov (United States)

    Zhao, Zhenli; Luo, Zhenlin; Liu, Chihui; Wu, Wenbin; Gao, Chen; Lu, Yalin

    2008-06-01

    This article describes a new approach to quantitatively measure the piezoelectric coefficients of thin films at the microscopic level using a scanning evanescent microwave microscope. This technique can resolve 10 pm deformation caused by the piezoelectric effect and has the advantages of high scanning speed, large scanning area, submicron spatial resolution, and a simultaneous accessibility to many other related properties. Results from the test measurements on the longitudinal piezoelectric coefficient of PZT thin film agree well with those from other techniques listed in literatures.

  12. Note: long-range scanning tunneling microscope for the study of nanostructures on insulating substrates.

    Science.gov (United States)

    Molina-Mendoza, Aday J; Rodrigo, José G; Island, Joshua; Burzuri, Enrique; Rubio-Bollinger, Gabino; van der Zant, Herre S J; Agraït, Nicolás

    2014-02-01

    The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

  13. Note: Long-range scanning tunneling microscope for the study of nanostructures on insulating substrates

    Energy Technology Data Exchange (ETDEWEB)

    Molina-Mendoza, Aday J., E-mail: aday.molina@uam.es [Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain); Rodrigo, José G.; Rubio-Bollinger, Gabino [Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain); Condensed Matter Physics Center (IFIMAC) and Instituto Universitario de Ciencia de Materiales “Nicolás Cabrera,” Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain); Island, Joshua; Burzuri, Enrique; Zant, Herre S. J. van der [Kavli Institute of Nanoscience, Delft University of Technology, P.O. Box 5046, 2600 GA Delft (Netherlands); Agraït, Nicolás [Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain); Condensed Matter Physics Center (IFIMAC) and Instituto Universitario de Ciencia de Materiales “Nicolás Cabrera,” Universidad Autónoma de Madrid, Campus de Cantoblanco, E-28049 Madrid (Spain); Instituto Madrileño de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, E-28049 Madrid (Spain)

    2014-02-15

    The scanning tunneling microscope (STM) is a powerful tool for studying the electronic properties at the atomic level, however, it is of relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting of conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

  14. Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film.

    Science.gov (United States)

    Nishiyama, Hidetoshi; Suga, Mitsuo; Ogura, Toshihiko; Maruyama, Yuusuke; Koizumi, Mitsuru; Mio, Kazuhiro; Kitamura, Shinichi; Sato, Chikara

    2010-03-01

    Direct observation of subcellular structures and their characterization is essential for understanding their physiological functions. To observe them in open environment, we have developed an inverted scanning electron microscope with a detachable, open-culture dish, capable of 8 nm resolution, and combined with a fluorescence microscope quasi-simultaneously observing the same area from the top. For scanning electron microscopy from the bottom, a silicon nitride film window in the base of the dish maintains a vacuum between electron gun and open sample dish while allowing electrons to pass through. Electrons are backscattered from the sample and captured by a detector under the dish. Cells cultured on the open dish can be externally manipulated under optical microscopy, fixed, and observed using scanning electron microscopy. Once fine structures have been revealed by scanning electron microscopy, their component proteins may be identified by comparison with separately prepared fluorescence-labeled optical microscopic images of the candidate proteins, with their heavy-metal-labeled or stained ASEM images. Furthermore, cell nuclei in a tissue block stained with platinum-blue were successfully observed without thin-sectioning, which suggests the applicability of this inverted scanning electron microscope to cancer diagnosis. This microscope visualizes mesoscopic-scale structures, and is also applicable to non-bioscience fields including polymer chemistry. (c) 2010 Elsevier Inc. All rights reserved.

  15. Use of a scanning electron microscope for examining radioactive materials

    International Nuclear Information System (INIS)

    Kauffmann, Yves; Prouve, Michel.

    1981-05-01

    The LAMA laboratory of the Grenoble Nuclear Research Center participates in studies carried out by research teams on fuels. Post-irradiation studies are performed on irradiated pins for research and development and safety programs. A scanning electron microscope was acquired for this purpose. This microscope had to fulfill certain criteria: it had to be sufficiently compact for it to be housed in a lead enclosure; it had to be capable of being adapted to operate with remote handling control. The modifications made to this microscope are briefly described together with the ancillary equipment of the cell. In parallel with these operations, an interconnection was realized enabling materials to be transferred between the various sampling and sample preparation cells and the microscope cell with a small transfer cask. After two years operating experience the microscope performance has been assessed satisfactory. The specific radioactivity of the samples themselves cannot be incriminated as the only cause of loss in resolution at magnifications greater than x 10,000 [fr

  16. Transmission environmental scanning electron microscope with scintillation gaseous detection device.

    Science.gov (United States)

    Danilatos, Gerasimos; Kollia, Mary; Dracopoulos, Vassileios

    2015-03-01

    A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. Copyright © 2014 Elsevier B.V. All rights reserved.

  17. Practical application of HgI2 detectors to a space-flight scanning electron microscope

    Science.gov (United States)

    Bradley, J. G.; Conley, J. M.; Albee, A. L.; Iwanczyk, J. S.; Dabrowski, A. J.

    1989-01-01

    Mercuric iodide X-ray detectors have been undergoing tests in a prototype scanning electron microscope system being developed for unmanned space flight. The detector program addresses the issues of geometric configuration in the SEM, compact packaging that includes separate thermoelectric coolers for the detector and FET, X-ray transparent hermetic encapsulation and electrical contacts, and a clean vacuum environment.

  18. Imaging of Norway spruce early somatic embryos with the ESEM, Cryo-SEM and laser scanning microscope.

    Science.gov (United States)

    Neděla, Vilém; Hřib, Jiří; Havel, Ladislav; Hudec, Jiří; Runštuk, Jiří

    2016-05-01

    This article describes the surface structure of Norway spruce early somatic embryos (ESEs) as a typical culture with asynchronous development. The microstructure of extracellular matrix covering ESEs were observed using the environmental scanning electron microscope as a primary tool and using the scanning electron microscope with cryo attachment and laser electron microscope as a complementary tool allowing our results to be proven independently. The fresh samples were observed in conditions of the air environment of the environmental scanning electron microscope (ESEM) with the pressure from 550Pa to 690Pa and the low temperature of the sample from -18°C to -22°C. The samples were studied using two different types of detector to allow studying either the thin surface structure or material composition. The scanning electron microscope with cryo attachment was used for imaging frozen extracellular matrix microstructure with higher resolution. The combination of both electron microscopy methods was suitable for observation of "native" plant samples, allowing correct evaluation of our results, free of error and artifacts. Copyright © 2016 Elsevier Ltd. All rights reserved.

  19. Dynamic Low-Vacuum Scanning Electron Microscope Freeze Drying Observation for Fresh Water Algae

    International Nuclear Information System (INIS)

    Mohsen, H.T.; Ghaly, W.A.; Zahran, N.F.; Helal, A.I.

    2010-01-01

    A new perpetration method for serving in dynamic examinations of the fresh water algae is developed in connection with the Low-Vacuum Scanning Electron Microscope (LV-SEM) freeze drying technique. Specimens are collected from fresh water of Ismailia channel then transferred directly to freeze by liquid nitrogen and dried in the chamber of the scanning electron microscope in the low vacuum mode. Scanning electron micrographs revealed that the drying method presented the microstructure of algae. Dehydration in a graded ethanol series is not necessary in the new method. Dried algae specimen is observed in SEM high vacuum mode after conductive coating at higher resolution. Low-vacuum SEM freeze drying technique is a simple, time-saving and reproducible method for scanning electron microscopy that is applicable to various aquatic microorganisms covered with soft tissues.

  20. A combined scanning tunneling microscope-atomic layer deposition tool.

    Science.gov (United States)

    Mack, James F; Van Stockum, Philip B; Iwadate, Hitoshi; Prinz, Fritz B

    2011-12-01

    We have built a combined scanning tunneling microscope-atomic layer deposition (STM-ALD) tool that performs in situ imaging of deposition. It operates from room temperature up to 200 °C, and at pressures from 1 × 10(-6) Torr to 1 × 10(-2) Torr. The STM-ALD system has a complete passive vibration isolation system that counteracts both seismic and acoustic excitations. The instrument can be used as an observation tool to monitor the initial growth phases of ALD in situ, as well as a nanofabrication tool by applying an electric field with the tip to laterally pattern deposition. In this paper, we describe the design of the tool and demonstrate its capability for atomic resolution STM imaging, atomic layer deposition, and the combination of the two techniques for in situ characterization of deposition.

  1. Design and properties of a cryogenic dip-stick scanning tunneling microscope with capacitive coarse approach control.

    Science.gov (United States)

    Schlegel, R; Hänke, T; Baumann, D; Kaiser, M; Nag, P K; Voigtländer, R; Lindackers, D; Büchner, B; Hess, C

    2014-01-01

    We present the design, setup, and operation of a new dip-stick scanning tunneling microscope. Its special design allows measurements in the temperature range from 4.7 K up to room temperature, where cryogenic vacuum conditions are maintained during the measurement. The system fits into every (4)He vessel with a bore of 50 mm, e.g., a transport dewar or a magnet bath cryostat. The microscope is equipped with a cleaving mechanism for cleaving single crystals in the whole temperature range and under cryogenic vacuum conditions. For the tip approach, a capacitive automated coarse approach is implemented. We present test measurements on the charge density wave system 2H-NbSe2 and the superconductor LiFeAs which demonstrate scanning tunneling microscopy and spectroscopy data acquisition with high stability, high spatial resolution at variable temperatures and in high magnetic fields.

  2. Large area fabrication of plasmonic nanoparticle grating structure by conventional scanning electron microscope

    International Nuclear Information System (INIS)

    Sudheer,; Tiwari, P.; Rai, V. N.; Srivastava, A. K.; Mukharjee, C.

    2015-01-01

    Plasmonic nanoparticle grating (PNG) structure of different periods has been fabricated by electron beam lithography using silver halide based transmission electron microscope film as a substrate. Conventional scanning electron microscope is used as a fabrication tool for electron beam lithography. Optical microscope and energy dispersive spectroscopy (EDS) have been used for its morphological and elemental characterization. Optical characterization is performed by UV-Vis absorption spectroscopic technique

  3. Analytical scanning evanescent microwave microscope and control stage

    Science.gov (United States)

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  4. In-Situ Microprobe Observations of Dispersed Oil with Low-Temperature Low-Vacuum Scanning Electron Microscope

    International Nuclear Information System (INIS)

    Mohsen, H.T.

    2010-01-01

    A low cost cryostat stage from high heat capacity material is designed and constructed, in attempt to apply size distribution techniques for examination of oil dispersions. Different materials were tested according to their heat capacity to keep the liquid under investigation in frozen state as long as possible during the introduction of the cryostat stage to the low-vacuum scanning electron microscope. Different concentrations of non ionic surfactant were added to artificially contaminated with 10000 ppm Balayeam base oil in 3.5 % saline water, where oil and dispersing liquid have been added and shacked well to be investigated under the microscope as fine frozen droplets. The efficiency of dispersion was examined using low temperature low-vacuum scanning electron microscope. The shape and size distributions of freeze oil droplets were studied by digital imaging processing technique in conjunction with scanning electron microscope counting method. Also elemental concentration of oil droplets was analyzed.

  5. Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

    Science.gov (United States)

    de Jonge, Niels [Oak Ridge, TN

    2010-08-17

    A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

  6. Development of a micromirror-scanned multimodal CARS miniaturized microscope for the in vivo study of spinal cord disorders

    Science.gov (United States)

    Murugkar, Sangeeta; Smith, Brett; Naji, Majid; Brideau, Craig; Stys, Peter; Anis, Hanan

    2011-03-01

    We discuss the design and implementation of a novel multimodal coherent anti-Stokes Raman scattering (CARS) miniaturized microscope for imaging of injured and recovering spinal cords in a single living animal. We demonstrate for the first time, the use of a biaxial microelectromechanical system (MEMS) mirror for scanning and diffraction limited multiple lens miniaturized objective for exciting a CARS signal. The miniaturized microscope design includes light delivery using a large mode area photonic crystal fiber (PCF), and multimode fiber for collection of the nonlinear optical signal. The basic design concept, major engineering challenges, solutions, and preliminary results are presented. We demonstrate CARS and two photon excitation fluorescence microscopy in a benchtop setup with the miniaturized optics and MEMS scanning. The light source is based on a single femtosecond laser (pump beam) and a supercontinuum generated in a nonlinear PCF (Stokes beam). This is coupled using free space optics onto the surface of a resonantly driven two dimensional scanning MEMS mirror that scans the excitation light in a Lissajous pattern. The novel design of the miniaturized microscope is expected to provide significant new information on the pathogenesis of demyelinating diseases such as Multiple Sclerosis and Spinal Cord Injury.

  7. Detection of picosecond electrical transients in a scanning tunneling microscope

    NARCIS (Netherlands)

    Groeneveld, R.H.M.; Rasing, T.H.M.; Kaufmann, L.M.F.; Smalbrugge, E.; Wolter, J.H.; Melloch, M.R.; Kempen, van H.

    1996-01-01

    We have developed a scanning tunneling microscope using an optoelectronic switch which gates the tunneling tip current. The switch is fabricated within several tens of microns from the tip by photolithography and an accurate cleavage method. We demonstrate this approach by detecting picosecond

  8. Simulation and Characterization of a Miniaturized Scanning Electron Microscope

    Science.gov (United States)

    Gaskin, Jessica A.; Jerman, Gregory A.; Medley, Stephanie; Gregory, Don; Abbott, Terry O.; Sampson, Allen R.

    2011-01-01

    A miniaturized Scanning Electron Microscope (mSEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), the University of Tennessee in Knoxville (UTK) and Case Western Reserve University (CWRU). This effort focuses on the characterization of individual components of the mSEM and simulation of the complete system. SEMs can provide information on the size, shape, morphology and chemical composition of lunar regolith. Understanding these basic properties will allow us to better estimate the challenges associated with In-Situ Resource Utilization and to improve our basic science knowledge of the lunar surface (either precluding the need for sample return or allowing differentiation of unique samples to be returned to Earth.) The main components of the mSEM prototype includes: a cold field emission electron gun (CFEG), focusing lens, deflection/scanning system and backscatter electron detector. Of these, the electron gun development is of particular importance as it dictates much of the design of the remaining components. A CFEG was chosen for use with the lunar mSEM as its emission does not depend on heating of the tungsten emitter (lower power), it offers a long operation lifetime, is orders of magnitude brighter than tungsten hairpin guns, has a small source size and exhibits low beam energy spread.

  9. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization.

    Science.gov (United States)

    Berger, Andrew J; Page, Michael R; Jacob, Jan; Young, Justin R; Lewis, Jim; Wenzel, Lothar; Bhallamudi, Vidya P; Johnston-Halperin, Ezekiel; Pelekhov, Denis V; Hammel, P Chris

    2014-12-01

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  10. Construction of a four tip scanning tunneling microscope/scanning electron microscope combination and conductivity measurements of silicide nanowires; Aufbau einer Vierspitzen-Rastertunnelmikroskop/Rasterelektronenmikroskop-Kombination und Leitfaehigkeitsmessungen an Silizid Nanodraehten

    Energy Technology Data Exchange (ETDEWEB)

    Zubkov, Evgeniy

    2013-09-01

    In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7 x 7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement

  11. Scanning differential polarization microscope: Its use to image linear and circular differential scattering

    International Nuclear Information System (INIS)

    Mickols, W.; Maestre, M.F.

    1988-01-01

    A differential polarization microscope that couples the sensitivity of single-beam measurement of circular dichroism and circular differential scattering with the simultaneous measurement of linear dichroism and linear differential scattering has been developed. The microscope uses a scanning microscope stage and single-point illumination to give the very shallow depth of field found in confocal microscopy. This microscope can operate in the confocal mode as well as in the near confocal condition that can allow one to program the coherence and spatial resolution of the microscope. This microscope has been used to study the change in the structure of chromatin during the development of sperm in Drosophila

  12. Fabrication of metallic nanowires with a scanning tunnelling microscope

    NARCIS (Netherlands)

    Kramer, N.; Kramer, N.; Birk, H.; Jorritsma, J.; Schönenberger, C.

    1995-01-01

    A procedure to pattern thin metal films on a nanometer scale with a scanning tunneling microscope (STM) operating in air is reported. A 30 nm film of hydrogenated amorphous silicon (a‐Si:H) is deposited on a 10 nm film of TaIr. Applying a negative voltage between the STM tip and the a‐Si:H film

  13. High-resolution, high-throughput imaging with a multibeam scanning electron microscope.

    Science.gov (United States)

    Eberle, A L; Mikula, S; Schalek, R; Lichtman, J; Knothe Tate, M L; Zeidler, D

    2015-08-01

    Electron-electron interactions and detector bandwidth limit the maximal imaging speed of single-beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed by close to two orders of magnitude and demonstrate imaging for a variety of samples ranging from biological brain tissue to semiconductor wafers. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

  14. Microscopic appearance analysis of raw material used for the production of sintered UO2 by scanning electron microscope

    International Nuclear Information System (INIS)

    Liu feiming

    1992-01-01

    The paper describes the microscopic appearance of UO 2 , U 3 O 8 , ADU and AUC powders used for the production of sintered UO 2 slug of nuclear fuel component of PWR. The characteristic analysis of the microscopic appearance observed by scanning electron microscope shows that the quality and finished product rate of sintered UO 2 depend on the appearance characteristic of the active Uo 2 powder, such as grade size and its distribution, spherulitized extent, surface condition and heap model etc.. The addition of U 3 O 8 to the UO 2 powder improves significantly the quality and the finished product rate. The mechanism of this effect is discussed on the basis of the microscopic appearance characteristic for two kinds of powder

  15. Magneto-optical Faraday effect probed in a scanning tunneling microscope

    NARCIS (Netherlands)

    Prins, M.W.J.; Wielen, van der M.C.M.M.; Abraham, D.L.; Kempen, van H.; Kesteren, van H.W.

    1994-01-01

    Semiconductor tips are used as local photodetectors in a scanning tunneling microscope. We demonstrate that this configuration is sensitive to small light intensity variations, as supported by a simple model. The principle is applied to the detection of Faraday ellipticity of a Pt/Co multilayer

  16. A landmark-based method for the geometrical 3D calibration of scanning microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Ritter, M.

    2007-04-27

    This thesis presents a new strategy and a spatial method for the geometric calibration of 3D measurement devices at the micro-range, based on spatial reference structures with nanometersized landmarks (nanomarkers). The new method was successfully applied for the 3D calibration of scanning probe microscopes (SPM) and confocal laser scanning microscopes (CLSM). Moreover, the spatial method was also used for the photogrammetric self-calibration of scanning electron microscopes (SEM). In order to implement the calibration strategy to all scanning microscopes used, the landmark-based principle of reference points often applied at land survey or at close-range applications has been transferred to the nano- and micro-range in the form of nanomarker. In order to function as a support to the nanomarkers, slope-shaped step pyramids have been developed and fabricated by focused ion beam (FIB) induced metal deposition. These FIB produced 3D microstructures have been sized to embrace most of the measurement volume of the scanning microscopes. Additionally, their special design allows the homogenous distribution of the nanomarkers. The nanomarkers were applied onto the support and the plateaus of the slope-step pyramids by FIB etching (milling) as landmarks with as little as several hundreds of nanometers in diameter. The nanomarkers are either of point-, or ring-shaped design. They are optimized so that they can be spatially measured by SPM and CLSM, and, imaged and photogrammetrically analyzed on the basis of SEM data. The centre of the each nanomarker serves as reference point in the measurement data or images. By applying image processing routines, the image (2D) or object (3D) coordinates of each nanomarker has been determined with subpixel accuracy. The correlative analysis of the SPM, CLSM and photogrammetric SEM measurement data after 3D calibration resulted in mean residues in the measured coordinates of as little as 13 nm. Without the coupling factors the mean

  17. Scanning optical microscope with long working distance objective

    Science.gov (United States)

    Cloutier, Sylvain G.

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  18. A scanning tunneling microscope for a dilution refrigerator.

    Science.gov (United States)

    Marz, M; Goll, G; Löhneysen, H v

    2010-04-01

    We present the main features of a home-built scanning tunneling microscope that has been attached to the mixing chamber of a dilution refrigerator. It allows scanning tunneling microscopy and spectroscopy measurements down to the base temperature of the cryostat, T approximately 30 mK, and in applied magnetic fields up to 13 T. The topography of both highly ordered pyrolytic graphite and the dichalcogenide superconductor NbSe(2) has been imaged with atomic resolution down to T approximately 50 mK as determined from a resistance thermometer adjacent to the sample. As a test for a successful operation in magnetic fields, the flux-line lattice of superconducting NbSe(2) in low magnetic fields has been studied. The lattice constant of the Abrikosov lattice shows the expected field dependence proportional to 1/square root of B and measurements in the scanning tunneling spectroscopy mode clearly show the superconductive density of states with Andreev bound states in the vortex core.

  19. Modulated photodetection with semiconductor tips in a scanning tunneling microscope

    NARCIS (Netherlands)

    Groeneveld, R.H.M.; Prins, M.W.J.; Kempen, van H.

    1995-01-01

    We report on the detection of modulated light power irradiated into the tunnel junction of a scanning tunneling microscope. When semiconductor tips are used we can distinguish three contributions to the measured current: photocurrent due to electron-hole pair generation at the apex of the tip, a

  20. Identification of mycobacterium tuberculosis in sputum smear slide using automatic scanning microscope

    Science.gov (United States)

    Rulaningtyas, Riries; Suksmono, Andriyan B.; Mengko, Tati L. R.; Saptawati, Putri

    2015-04-01

    Sputum smear observation has an important role in tuberculosis (TB) disease diagnosis, because it needs accurate identification to avoid high errors diagnosis. In development countries, sputum smear slide observation is commonly done with conventional light microscope from Ziehl-Neelsen stained tissue and it doesn't need high cost to maintain the microscope. The clinicians do manual screening process for sputum smear slide which is time consuming and needs highly training to detect the presence of TB bacilli (mycobacterium tuberculosis) accurately, especially for negative slide and slide with less number of TB bacilli. For helping the clinicians, we propose automatic scanning microscope with automatic identification of TB bacilli. The designed system modified the field movement of light microscope with stepper motor which was controlled by microcontroller. Every sputum smear field was captured by camera. After that some image processing techniques were done for the sputum smear images. The color threshold was used for background subtraction with hue canal in HSV color space. Sobel edge detection algorithm was used for TB bacilli image segmentation. We used feature extraction based on shape for bacilli analyzing and then neural network classified TB bacilli or not. The results indicated identification of TB bacilli that we have done worked well and detected TB bacilli accurately in sputum smear slide with normal staining, but not worked well in over staining and less staining tissue slide. However, overall the designed system can help the clinicians in sputum smear observation becomes more easily.

  1. Analytical electron microscope based on scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy to realize highly sensitive elemental imaging especially for light elements

    International Nuclear Information System (INIS)

    Koguchi, Masanari; Tsuneta, Ruriko; Anan, Yoshihiro; Nakamae, Koji

    2017-01-01

    An analytical electron microscope based on the scanning transmission electron microscope with wavelength dispersive x-ray spectroscopy (STEM-WDX) to realize highly sensitive elemental imaging especially for light elements has been developed. In this study, a large-solid-angle multi-capillary x-rays lens with a focal length of 5 mm, long-time data acquisition (e.g. longer than 26 h), and a drift-free system made it possible to visualize boron-dopant images in a Si substrate at a detection limit of 0.2 atomic percent. (paper)

  2. Application of the laser scanning confocal microscope in fluorescent film sensor research

    Science.gov (United States)

    Zhang, Hongyan; Liu, Wei-Min; Zhao, Wen-Wen; Dai, Qing; Wang, Peng-Fei

    2010-10-01

    Confocal microscopy offers several advantages over conventional optical microscopy; we show an experimental investigation laser scanning confocal microscope as a tool to be used in cubic boron nitride (cBN) film-based fluorescent sensor research. Cubic boron nitride cBN film sensors are modified with dansyl chloride and rhodamine B isothiocyanate respectively. Fluorescent modification quality on the cubic boron nitride film is clearly express and the sensor ability to Hg2+ cations and pH are investigated in detail. We evidence the rhodamine B isothiocyanate modified quality on cBN surface is much better than that of dansyl chloride. And laser scanning confocal microscope has potential application lighttight fundus film fluorescent sensor research.

  3. Creation of stable molecular junctions with a custom-designed scanning tunneling microscope.

    Science.gov (United States)

    Lee, Woochul; Reddy, Pramod

    2011-12-02

    The scanning tunneling microscope break junction (STMBJ) technique is a powerful approach for creating single-molecule junctions and studying electrical transport in them. However, junctions created using the STMBJ technique are usually mechanically stable for relatively short times (scanning tunneling microscope that enables the creation of metal-single molecule-metal junctions that are mechanically stable for more than 1 minute at room temperature. This stability is achieved by a design that minimizes thermal drift as well as the effect of environmental perturbations. The utility of this instrument is demonstrated by performing transition voltage spectroscopy-at the single-molecule level-on Au-hexanedithiol-Au, Au-octanedithiol-Au and Au-decanedithiol-Au junctions.

  4. A modular scanning tunneling microscope with an interchangeable elastic closed cell and external actuators

    International Nuclear Information System (INIS)

    Bjarnason, Elias H.; Arnalds, Unnar B.; Olafsson, Sveinn

    2006-01-01

    We introduce a novel modular cell based scanning tunneling microscope with external piezoelectric actuators. A tip and a sample are contained in a closed interchangeable cell, consisting of a stiff top plate and a bottom part, fastened together by an elastic material. The bottom part, containing a scanning tip, is fastened to a base unit while the top plate, containing a sample, is capable of scanning motion by external piezoelectric actuators mounted in the same base unit. The actuators are pre-loaded by the deformation of the elastic material of the cell, giving an increased stability. This design is expected to simplify the scanning tunneling microscope (STM) operation in difficult environments greatly by enclosing only the tip and sample in a small cell-module, which is pluggable to a scanning mechanism and other supportive functionalities. A frequency characterization and an image scan showing atomic resolution of highly oriented graphite in air, at room temperature, is presented

  5. Scanning-electron-microscope study of normal-impingement erosion of ductile metals

    Science.gov (United States)

    Brainard, W. A.; Salik, J.

    1980-01-01

    Scanning electron microscopy was used to characterize the erosion of annealed copper and aluminum surfaces produced by both single- and multiple-particle impacts. Macroscopic 3.2 mm diameter steel balls and microscopic, brittle erodant particles were projected by a gas gun system so as to impact at normal incidence at speeds up to 140 m/sec. During the impacts by the brittle erodant particles, at lower speeds the erosion behavior was similar to that observed for the larger steel balls. At higher velocities, particle fragmentation and the subsequent cutting by the radial wash of debris created a marked change in the erosion mechanism.

  6. Atomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator.

    Science.gov (United States)

    Li, Quanfeng; Lu, Qingyou

    2011-05-01

    We present an ultra-fast scanning tunneling microscope with atomic resolution at 26 kHz scan rate which surpasses the resonant frequency of the quartz tuning fork resonator used as the fast scan actuator. The main improvements employed in achieving this new record are (1) fully low voltage design (2) independent scan control and data acquisition, where the tuning fork (carrying a tip) is blindly driven to scan by a function generator with the scan voltage and tunneling current (I(T)) being measured as image data (this is unlike the traditional point-by-point move and measure method where data acquisition and scan control are switched many times).

  7. Large-scale high-resolution scanning Hall probe microscope used for MgB2 filament characterization

    International Nuclear Information System (INIS)

    Cambel, V; Fedor, J; Gregusova, D; Kovac, P; Husek, I

    2005-01-01

    The scanning Hall probe microscope (SHPM) is an important imaging tool used for detailed studies of superconductors in basic science as well as in the industrial sector. It can be used for the studies of losses, current distribution, and effects at grain boundaries. However, only a few SHPMs for magnetic field imaging at temperatures below 77 K have been proposed up to now, most of them designed for small-area (∼10x10 μm 2 ) scanning. We present a large-scale low-temperature SHPM developed for imaging the entire magnetic field in close proximity to magnetic and superconducting samples at 4.2-300 K. The microscope combines a large scanned area and high spatial and magnetic field resolution. The instrument is designed as an insert of standard helium flowing cryostats. The Hall sensor scans an area up to 7 x 25 mm 2 in the whole temperature interval with a spatial resolution better than 5 μm. The presented system is used for the study of ex situ prepared MgB 2 filament. We show that external magnetic field induces local supercurrents in the MgB 2 , from which the critical current can be estimated. Moreover, it indicates the microstructure and space homogeneity of the superconductor

  8. Coupling scanning tunneling microscope and supersonic molecular beams: a unique tool for in situ investigation of the morphology of activated systems.

    Science.gov (United States)

    Smerieri, M; Reichelt, R; Savio, L; Vattuone, L; Rocca, M

    2012-09-01

    We report here on a new experimental apparatus combining a commercial low temperature scanning tunneling microscope with a supersonic molecular beam. This setup provides a unique tool for the in situ investigation of the topography of activated adsorption systems and opens thus new interesting perspectives. It has been tested towards the formation of the O/Ag(110) added rows reconstruction and of their hydroxylation, comparing data recorded upon O(2) exposure at thermal and hyperthermal energies.

  9. A modular designed ultra-high-vacuum spin-polarized scanning tunneling microscope with controllable magnetic fields for investigating epitaxial thin films.

    Science.gov (United States)

    Wang, Kangkang; Lin, Wenzhi; Chinchore, Abhijit V; Liu, Yinghao; Smith, Arthur R

    2011-05-01

    A room-temperature ultra-high-vacuum scanning tunneling microscope for in situ scanning freshly grown epitaxial films has been developed. The core unit of the microscope, which consists of critical components including scanner and approach motors, is modular designed. This enables easy adaptation of the same microscope units to new growth systems with different sample-transfer geometries. Furthermore the core unit is designed to be fully compatible with cryogenic temperatures and high magnetic field operations. A double-stage spring suspension system with eddy current damping has been implemented to achieve ≤5 pm z stability in a noisy environment and in the presence of an interconnected growth chamber. Both tips and samples can be quickly exchanged in situ; also a tunable external magnetic field can be introduced using a transferable permanent magnet shuttle. This allows spin-polarized tunneling with magnetically coated tips. The performance of this microscope is demonstrated by atomic-resolution imaging of surface reconstructions on wide band-gap GaN surfaces and spin-resolved experiments on antiferromagnetic Mn(3)N(2)(010) surfaces.

  10. Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical properties.

    Science.gov (United States)

    Bercu, N B; Troyon, M; Molinari, M

    2016-09-01

    An original scanning near-field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM-based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near-field cathodoluminescence and topographic images of the sample. Share-force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques. © 2016 The Authors Journal of Microscopy © 2016 Royal Microscopical Society.

  11. The Scanning TMR Microscope for Biosensor Applications

    Directory of Open Access Journals (Sweden)

    Kunal N. Vyas

    2015-04-01

    Full Text Available We present a novel tunnel magnetoresistance (TMR scanning microscopeset-up capable of quantitatively imaging the magnetic stray field patterns of micron-sizedelements in 3D. By incorporating an Anderson loop measurement circuit for impedancematching, we are able to detect magnetoresistance changes of as little as 0.006%/Oe. By 3Drastering a mounted TMR sensor over our magnetic barcodes, we are able to characterisethe complex domain structures by displaying the real component, the amplitude and thephase of the sensor’s impedance. The modular design, incorporating a TMR sensor withan optical microscope, renders this set-up a versatile platform for studying and imagingimmobilised magnetic carriers and barcodes currently employed in biosensor platforms,magnetotactic bacteria and other complex magnetic domain structures of micron-sizedentities. The quantitative nature of the instrument and its ability to produce vector maps ofmagnetic stray fields has the potential to provide significant advantages over other commonlyused scanning magnetometry techniques.

  12. In situ scanning tunneling microscope tip treatment device for spin polarization imaging

    Science.gov (United States)

    Li, An-Ping [Oak Ridge, TN; Jianxing, Ma [Oak Ridge, TN; Shen, Jian [Knoxville, TN

    2008-04-22

    A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM to a spin-polarized tip, and thereby converts a standard STM system into a spin-polarized STM system. The tip treatment device also has functions of tip cleaning and tip flashing a STM tip to high temperature (>2000.degree. C.) in an extremely localized fashion. Tip coating functions can also be carried out, providing the tip sharp end with monolayers of coating materials including magnetic films. The device is also fully compatible with ultrahigh vacuum sample transfer setups.

  13. Undulator based scanning microscope at the National Synchrotron Light Source

    International Nuclear Information System (INIS)

    Rarback, H.; Shu, D.; Ade, H.; Jacobsen, C.; Kirz, J.; McNulty, I.; Rosser, R.

    1986-01-01

    A second generation scanning soft x-ray microscope is under construction, designed to utilize the dramatic increase in source bightness available at the soft x-ray undulator. The new instrument is expected to reduce image acquisition time by a factor of about 100, and to improve resolution, stability, and reproducibility

  14. Examination of mycological samples by means of the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M. Thibaut

    1973-04-01

    Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.

  15. A scanning photoelectron microscope (SPEM) at the National Synchrotron Light Source (NSLS)

    International Nuclear Information System (INIS)

    Ade, H.; Kirz, J.; Hulbert, S.; Johnson, E.; Anderson, E.; Kern, D.; Brookhaven National Lab., Upton, NY; Lawrence Berkeley Lab., CA; International Business Machines Corp., Yorktown Heights, NY

    1989-01-01

    We are in the process of developing and commissioning a scanning photoelectron microscope (SPEM) at the X1A beamline of the National Synchrotron Light Source (NSLS). It is designed to make use of the Soft X-ray Undulator (SXU) at the NSLS. This high brightness source illuminates a Fresnel zone plate, which forms a focused probe, ≤ 0.2μm in size, on the specimen surface. A grating monochromator selects the photon energy in the 400-800 eV range with an energy resolution of better than 1 eV. The expected flux in the focus is in the 5 x 10 7 - 10 9 photons/s range. A single pass Cylindrical Mirror Analyzer (CMA) is used to record photoemission spectra, or to form an image within a fixed electron energy bandwidth as the specimen is mechanically scanned. As a first test, a 1000 mesh Au grid was successfully imaged with a resolution of about 1μm and the CMA tuned to the Au 4 f photoelectron peak. Once it is commissioned, a program is planned which will utilize the microscope to study beam sensitive systems, such as thin oxide/sub-oxide films of alumina and silica, and ultimately various adsorbates on these films. 14 refs., 4 figs

  16. Contact detection for nanomanipulation in a scanning electron microscope.

    Science.gov (United States)

    Ru, Changhai; To, Steve

    2012-07-01

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000× magnification while inducing little end-effector damage. Copyright © 2012 Elsevier B.V. All rights reserved.

  17. A scanning electron microscopic investigation of ceramic orthodontic brackets

    International Nuclear Information System (INIS)

    McDonald, F.; Toms, A.P.

    1990-01-01

    Ceramic brackets were introduced to overcome the esthetic disadvantages of stainless steel brackets. The clinical impression of these brackets is very favorable. However, the sliding mechanics used in the Straightwire (A Company, San Diego, CA, USA) system appear to produce slower tooth movements with ceramic compared to stainless steel brackets. To determine whether this was due to any obvious mechanical problem in the bracket slot, Transcend (Unitek Corporation/3M, Monrovia, CA, USA) ceramic brackets were examined by a scanning electron microscope and compared to stainless steel brackets.Consistently, large surface defects were found in the ceramic bracket slots that were not present in the metal bracket slots. These irregularities could obviously hinder the sliding mechanics of the bracket slot-archwire system and create a greater demand on anchorage. Conversely, the fitting surface of the Transcend ceramic bracket showed extremely smooth surface characteristics, and it would seem advisable for the manufacturers to incorporate this surface within the bracket slot. (author)

  18. Screening small-molecule compound microarrays for protein ligands without fluorescence labeling with a high-throughput scanning microscope

    OpenAIRE

    Fei, Yiyan; Landry, James P.; Sun, Yungshin; Zhu, Xiangdong; Wang, Xiaobing; Luo, Juntao; Wu, Chun-Yi; Lam, Kit S.

    2010-01-01

    We describe a high-throughput scanning optical microscope for detecting small-molecule compound microarrays on functionalized glass slides. It is based on measurements of oblique-incidence reflectivity difference and employs a combination of a y-scan galvometer mirror and an x-scan translation stage with an effective field of view of 2 cm×4 cm. Such a field of view can accommodate a printed small-molecule compound microarray with as many as 10,000 to 20,000 targets. The scanning microscope is...

  19. Note: Automated electrochemical etching and polishing of silver scanning tunneling microscope tips.

    Science.gov (United States)

    Sasaki, Stephen S; Perdue, Shawn M; Rodriguez Perez, Alejandro; Tallarida, Nicholas; Majors, Julia H; Apkarian, V Ara; Lee, Joonhee

    2013-09-01

    Fabrication of sharp and smooth Ag tips is crucial in optical scanning probe microscope experiments. To ensure reproducible tip profiles, the polishing process is fully automated using a closed-loop laminar flow system to deliver the electrolytic solution to moving electrodes mounted on a motorized translational stage. The repetitive translational motion is controlled precisely on the μm scale with a stepper motor and screw-thread mechanism. The automated setup allows reproducible control over the tip profile and improves smoothness and sharpness of tips (radius 27 ± 18 nm), as measured by ultrafast field emission.

  20. Probing Field Distributions on Waveguide Structures with an Atomic Force/Photon Scanning Tunneling Microscope

    NARCIS (Netherlands)

    Borgonjen, E.G.; Borgonjen, E.G.; Moers, M.H.P.; Moers, M.H.P.; Ruiter, A.G.T.; van Hulst, N.F.

    1995-01-01

    A 'stand-alone' Photon Scanning Tunneling Microscope combined with an Atomic force Microscope, using a micro-fabricated silicon-nitride probe, is applied to the imaging of field distribution in integrated optical ridge waveguides. The electric field on the waveguide is locally probed by coupling to

  1. Improved coating and fixation methods for scanning electron microscope autoradiography

    International Nuclear Information System (INIS)

    Weiss, R.L.

    1984-01-01

    A simple apparatus for emulsion coating is described. The apparatus is inexpensive and easily assembled in a standard glass shop. Emulsion coating for scanning electron microscope autoradiography with this apparatus consistently yields uniform layers. When used in conjunction with newly described fixation methods, this new approach produces reliable autoradiographs of undamaged specimens

  2. Creation of stable molecular junctions with a custom-designed scanning tunneling microscope

    International Nuclear Information System (INIS)

    Lee, Woochul; Reddy, Pramod

    2011-01-01

    The scanning tunneling microscope break junction (STMBJ) technique is a powerful approach for creating single-molecule junctions and studying electrical transport in them. However, junctions created using the STMBJ technique are usually mechanically stable for relatively short times (<1 s), impeding detailed studies of their charge transport characteristics. Here, we report a custom-designed scanning tunneling microscope that enables the creation of metal–single molecule–metal junctions that are mechanically stable for more than 1 minute at room temperature. This stability is achieved by a design that minimizes thermal drift as well as the effect of environmental perturbations. The utility of this instrument is demonstrated by performing transition voltage spectroscopy—at the single-molecule level—on Au–hexanedithiol–Au, Au–octanedithiol–Au and Au–decanedithiol–Au junctions.

  3. Ultra compact multitip scanning tunneling microscope with a diameter of 50 mm.

    Science.gov (United States)

    Cherepanov, Vasily; Zubkov, Evgeny; Junker, Hubertus; Korte, Stefan; Blab, Marcus; Coenen, Peter; Voigtländer, Bert

    2012-03-01

    We present a multitip scanning tunneling microscope (STM) where four independent STM units are integrated on a diameter of 50 mm. The coarse positioning of the tips is done under the control of an optical microscope or scanning electron microscopy in vacuum. The heart of this STM is a new type of piezoelectric coarse approach called KoalaDrive. The compactness of the KoalaDrive allows building a four-tip STM as small as a single-tip STM with a drift of less than 0.2 nm/min at room temperature and lowest resonance frequencies of 2.5 kHz (xy) and 5.5 kHz (z). We present as examples of the performance of the multitip STM four point measurements of silicide nanowires and graphene.

  4. The 2-ID-B intermediate-energy scanning X-ray microscope at the APS

    International Nuclear Information System (INIS)

    McNulty, I.; Paterson, D.; Arko, J.; Erdmann, M.; Goetze, K.; Ilinski, P.; Mooney, T.; Vogt, S.; Xu, S.; Frigo, S.P.; Stampfl, A.P.J.; Wang, Y.

    2002-01-01

    The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent 1-4 keV x-rays to a 60 nm focal spot of 10 9 photons/s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nano-tomography of chips and micro-spectroscopy of cells. (authors)

  5. Scanning transmission x-ray microscope for materials science spectromicroscopy at the ALS

    Energy Technology Data Exchange (ETDEWEB)

    Warwick, T.; Seal, S.; Shin, H. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

    1997-04-01

    The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300{mu}m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.

  6. Optical detection of ballistic electrons injected by a scanning-tunneling microscope

    NARCIS (Netherlands)

    Kemerink, M.; Sauthoff, K.; Koenraad, P.M.; Gerritsen, J.W.; Kempen, van H.; Wolter, J.H.

    2001-01-01

    We demonstrate a spectroscopic technique which is based on ballistic injection of minority carriers from the tip of a scanning-tunneling microscope into a semiconductor heterostructure. By analyzing the resulting electroluminescence spectrum as a function of tip-sample bias, both the injection

  7. Excitation of propagating surface plasmons with a scanning tunnelling microscope.

    Science.gov (United States)

    Wang, T; Boer-Duchemin, E; Zhang, Y; Comtet, G; Dujardin, G

    2011-04-29

    Inelastic electron tunnelling excitation of propagating surface plasmon polaritons (SPPs) on a thin gold film is demonstrated. This is done by combining a scanning tunnelling microscope (STM) with an inverted optical microscope. Analysis of the leakage radiation in both the image and Fourier planes unambiguously shows that the majority (up to 99.5%) of the detected photons originate from propagating SPPs with propagation lengths of the order of 10  µm. The remaining photon emission is localized under the STM tip and is attributed to a tip-gold film coupled plasmon resonance as evidenced by the bimodal spectral distribution and enhanced emission intensity observed using a silver STM tip for excitation.

  8. Excitation of propagating surface plasmons with a scanning tunnelling microscope

    International Nuclear Information System (INIS)

    Wang, T; Boer-Duchemin, E; Zhang, Y; Comtet, G; Dujardin, G

    2011-01-01

    Inelastic electron tunnelling excitation of propagating surface plasmon polaritons (SPPs) on a thin gold film is demonstrated. This is done by combining a scanning tunnelling microscope (STM) with an inverted optical microscope. Analysis of the leakage radiation in both the image and Fourier planes unambiguously shows that the majority (up to 99.5%) of the detected photons originate from propagating SPPs with propagation lengths of the order of 10 μm. The remaining photon emission is localized under the STM tip and is attributed to a tip-gold film coupled plasmon resonance as evidenced by the bimodal spectral distribution and enhanced emission intensity observed using a silver STM tip for excitation.

  9. Excitation of propagating surface plasmons with a scanning tunnelling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, T; Boer-Duchemin, E; Zhang, Y; Comtet, G; Dujardin, G, E-mail: Elizabeth.Boer-Duchemin@u-psud.fr [Institut des Sciences Moleculaire d' Orsay (ISMO), CNRS Universite Paris-Sud, 91405 Orsay (France)

    2011-04-29

    Inelastic electron tunnelling excitation of propagating surface plasmon polaritons (SPPs) on a thin gold film is demonstrated. This is done by combining a scanning tunnelling microscope (STM) with an inverted optical microscope. Analysis of the leakage radiation in both the image and Fourier planes unambiguously shows that the majority (up to 99.5%) of the detected photons originate from propagating SPPs with propagation lengths of the order of 10 {mu}m. The remaining photon emission is localized under the STM tip and is attributed to a tip-gold film coupled plasmon resonance as evidenced by the bimodal spectral distribution and enhanced emission intensity observed using a silver STM tip for excitation.

  10. Reprint of: Atmospheric scanning electron microscope observes cells and tissues in open medium through silicon nitride film.

    Science.gov (United States)

    Nishiyama, Hidetoshi; Suga, Mitsuo; Ogura, Toshihiko; Maruyama, Yuusuke; Koizumi, Mitsuru; Mio, Kazuhiro; Kitamura, Shinichi; Sato, Chikara

    2010-11-01

    Direct observation of subcellular structures and their characterization is essential for understanding their physiological functions. To observe them in open environment, we have developed an inverted scanning electron microscope with a detachable, open-culture dish, capable of 8 nm resolution, and combined with a fluorescence microscope quasi-simultaneously observing the same area from the top. For scanning electron microscopy from the bottom, a silicon nitride film window in the base of the dish maintains a vacuum between electron gun and open sample dish while allowing electrons to pass through. Electrons are backscattered from the sample and captured by a detector under the dish. Cells cultured on the open dish can be externally manipulated under optical microscopy, fixed, and observed using scanning electron microscopy. Once fine structures have been revealed by scanning electron microscopy, their component proteins may be identified by comparison with separately prepared fluorescence-labeled optical microscopic images of the candidate proteins, with their heavy-metal-labeled or stained ASEM images. Furthermore, cell nuclei in a tissue block stained with platinum-blue were successfully observed without thin-sectioning, which suggests the applicability of this inverted scanning electron microscope to cancer diagnosis. This microscope visualizes mesoscopic-scale structures, and is also applicable to non-bioscience fields including polymer chemistry. Copyright © 2010 Elsevier Inc. All rights reserved.

  11. Self-mixing laser diode included in scanning microwave microscope to the control of probe nanodisplacement

    Science.gov (United States)

    Usanov, D. A.; Skripal, A. V.; Astakhov, E. I.; Dobdin, S. Y.

    2018-04-01

    The possibilities of self-mixing interferometry for measuring nanodisplacement of a probe included in a near-field scanning microwave microscope have been considered. The features of the formation of a laser interference signal at current modulation of the wavelength of laser radiation have been investigated. Experimental responses of a semiconductor laser system included in scanning microwave microscope to control nanodisplacement of the probe have been demonstrated.To register the nanodisplacement of the probe, it is proposed to use the method of determining the stationary phase of a laser interference signal by low-frequency spectrum of a semiconductor laser. The change of the amplitudes of the spectral components in the spectrum of the interference signal due to creation of the standing wave in the external resonator of the laser self-mixing system has been shown. The form of the interference signal at current modulation of the radiation wavelength was experimentally obtained when the probe moves with a step of 80 nm. The results of measuring nanodisplacements of an electromagnetic translator STANDA 8MVT40-13 have been demonstrated. Deviation of the nanodisplacement of the proposed method does not exceed 15%.

  12. Transient measurements with an ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1998-01-01

    We use a photoconductively gated ultrafast scanning tunneling microscope to resolve laser-induced transients on transmission lines and photoconductors. The photoconductive switch on the tunneling probe is illuminated through a rigidly attached fiber. The use of the fiber enables us to scan across...... the transmission line while the change in delay time between pump beam (on the sample) and probe beam (on the probe) provides the temporal information. The investigated photoconductor sample is a low-temperature-grown GaAs layer placed on a sapphire substrate with a thin, semitransparent gold layer. In tunneling...... mode the probe is sensitive to laser-induced field changes in the semiconductor layer. Laser-induced transient signals of 2.2 ps widths are detected. As for the transmission lines, the signals can be explained by a capacitive coupling across the tunneling gap....

  13. Contained scanning electron microscope facility for examining radioactive materials

    International Nuclear Information System (INIS)

    Hsu, C.W.

    1986-03-01

    At the Savannah River Laboratory (SRL) radioactive solids are characterized with a scanning electron microscope (SEM) contained in a glove box. The system includes a research-grade Cambridge S-250 SEM, a Tracor Northern TN-5500 x-ray and image analyzer, and a Microspec wavelength-dispersive x-ray analyzer. The containment facility has a glove box train for mounting and coating samples, and for housing the SEM column, x-ray detectors, and vacuum pumps. The control consoles of the instruments are located outside the glove boxes. This facility has been actively used since October 1983 for high alpha-activity materials such as plutonium metal and plutonium oxide powders. Radioactive defense waste glasses and contaminated equipment have also been examined. During this period the facility had no safety-related incidents, and personnel radiation exposures were maintained at less than 100 mrems

  14. High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

    Energy Technology Data Exchange (ETDEWEB)

    Adams, Jonathan D.; Nievergelt, Adrian; Erickson, Blake W.; Yang, Chen; Dukic, Maja; Fantner, Georg E., E-mail: georg.fantner@epfl.ch [Ecole Polytechnique Fédérale de Lausanne, Lausanne (Switzerland)

    2014-09-15

    We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5–10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100–500 Hz for scan areas of several micrometers in size.

  15. Electric field effects in scanning tunneling microscope imaging

    DEFF Research Database (Denmark)

    Stokbro, Kurt; Quaade, Ulrich; Grey, Francois

    1998-01-01

    We present a high-voltage extension of the Tersoff-Hamann theory of scanning tunneling microscope (STM) images, which includes the effect of the electric field between the tip and the sample. The theoretical model is based on first-principles electronic structure calculations and has no adjustable...... parameters. We use the method to calculate theoretical STM images of the monohydrate Si(100)-H(2x1) surface with missing hydrogen defects at -2V and find an enhanced corrugation due to the electric field, in good agreement with experimental images....

  16. Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization.

    Science.gov (United States)

    Brodusch, Nicolas; Demers, Hendrix; Trudeau, Michel; Gauvin, Raynald

    2013-01-01

    Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science characterization was illustrated through three examples of phase identification and orientation mapping. © Wiley Periodicals, Inc.

  17. Development of system and technology for moessbauer spectroscopic microscope

    Energy Technology Data Exchange (ETDEWEB)

    Hayakawa, Kazuo; Akiyama, Yuki; Tsukamoto, Yoshinori; Kurata, Mikio; Yukihira, Kenichi [Shizuoka Institute of Science and Technology (Japan); Soejima, Hiroyoshi [Shimadzu Corporation (Japan); Yoshida, Yutaka, E-mail: yoshida@ms.sist.ac.jp [Shizuoka Institute of Science and Technology (Japan)

    2012-03-15

    We have been developing a 'Moessbauer Spectroscopic Microscope (MSM)' which consists of a focusing lens for 14.4 keV {gamma}-rays and a high precision X-Y stage. The measuring system both for electrons and {gamma}-rays combined with a new Moessbauer driver, i.e., 'a moving coil actuator with a liner encoder' enables us to measure the mapping images simultaneously corresponding to different spectral components. The system has a controlling system based on a LabVIEW program and a LIST mode data acquisition system (NIKI-GLASS/A3100). To investigate a correlation between the microstructure of a sample and {sup 57}Fe atoms, a scanning electron microscope (APCO/Mini-EOC) is also installed to this system.

  18. A modular, open-source, slide-scanning microscope for diagnostic applications in resource-constrained settings.

    Directory of Open Access Journals (Sweden)

    Qiang Lu

    Full Text Available In this paper we report the development of a cost-effective, modular, open source, and fully automated slide-scanning microscope, composed entirely of easily available off-the-shelf parts, and capable of bright field and fluorescence modes. The automated X-Y stage is composed of two low-cost micrometer stages coupled to stepper motors operated in open-loop mode. The microscope is composed of a low-cost CMOS sensor and low-cost board lenses placed in a 4f configuration. The system has approximately 1 micron resolution, limited by the f/# of available board lenses. The microscope is compact, measuring just 25×25×30 cm, and has an absolute positioning accuracy of ±1 μm in the X and Y directions. A Z-stage enables autofocusing and imaging over large fields of view even on non-planar samples, and custom software enables automatic determination of sample boundaries and image mosaicking. We demonstrate the utility of our device through imaging of fluorescent- and transmission-dye stained blood and fecal smears containing human and animal parasites, as well as several prepared tissue samples. These results demonstrate image quality comparable to high-end commercial microscopes at a cost of less than US$400 for a bright-field system, with an extra US$100 needed for the fluorescence module.

  19. Application of piezoceramic materials in low temperature scanning tunnel microscope

    International Nuclear Information System (INIS)

    Volodin, A.P.; Panich, A.E.

    1989-01-01

    Temperature dependences of the voltage-to-movement conversion coefficients for piezoceramic domestic materials PKR and TsTS-19 are measured using a capacitance dilatometer in the 0.4< T<300K temperature range. Anisotropy of thermal expansion of materials determined by the polarization vector is observed. Some recommendations concerning the use of the given materials in low-temperature scanning tunnel microscopes are given

  20. Construction and performance of a dilution-refrigerator based spectroscopic-imaging scanning tunneling microscope.

    Science.gov (United States)

    Singh, U R; Enayat, M; White, S C; Wahl, P

    2013-01-01

    We report on the set-up and performance of a dilution-refrigerator based spectroscopic imaging scanning tunneling microscope. It operates at temperatures below 10 mK and in magnetic fields up to 14T. The system allows for sample transfer and in situ cleavage. We present first-results demonstrating atomic resolution and the multi-gap structure of the superconducting gap of NbSe(2) at base temperature. To determine the energy resolution of our system we have measured a normal metal/vacuum/superconductor tunneling junction consisting of an aluminum tip on a gold sample. Our system allows for continuous measurements at base temperature on time scales of up to ≈170 h.

  1. Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope.

    Science.gov (United States)

    Kwon, Sangjin; Jeong, Hyun; Jeong, Mun Seok; Jeong, Sungho

    2011-08-01

    A backscattering type ultraviolet apertureless near-field scanning optical microscope (ANSOM) for the correlated measurement of topographical and optical characteristics of photonic materials with high optical resolution was developed. The near-field Rayleigh scattering image of GaN covered with periodic submicron Cr dots showed that optical resolution around 40 nm was achievable. By measuring the tip scattered photoluminescence of InGaN/GaN multi quantum wells, the applicability of the developed microscope for high resolution fluorescence measurement was also demonstrated.

  2. Low temperature ultrahigh vacuum cross-sectional scanning tunneling microscope for luminescence measurements

    International Nuclear Information System (INIS)

    Khang, Yoonho; Park, Yeonjoon; Salmeron, Miquel; Weber, Eicke R.

    1999-01-01

    We have constructed a scanning tunneling microscope with simultaneous light collection capabilities in order to investigate the opto-electronic properties of semiconductors. The microscope has in situ sample cleavage mechanism for cross-sectional sample. In order to reach low temperature (4 K), we used a specially designed cryostat. The efficiency of light collection generated in the tip-surface junction was greatly improved by use of a small parabolic mirror with the tip located at its focal point. (c) 1999 American Institute of Physics

  3. Development and trial measurement of synchrotron-radiation-light-illuminated scanning tunneling microscope

    International Nuclear Information System (INIS)

    Matsushima, Takeshi; Okuda, Taichi; Eguchi, Toyoaki; Ono, Masanori; Harasawa, Ayumi; Wakita, Takanori; Kataoka, Akira; Hamada, Masayuki; Kamoshida, Atsushi; Hasegawa, Yukio; Kinoshita, Toyohiko

    2004-01-01

    Scanning tunneling microscope (STM) study is performed under synchrotron-radiation-light illumination. The equipment is designed so as to achieve atomic resolution even under rather noisy conditions in the synchrotron radiation facility. By measuring photoexcited electron current by the STM tip together with the conventional STM tunneling current, Si 2p soft-x-ray absorption spectra are successfully obtained from a small area of Si(111) surface. The results are a first step toward realizing a new element-specific microscope

  4. Fiber coupled ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1997-01-01

    We report on a scanning tunneling microscope with a photoconductive gate in the tunneling current circuit. The tunneling tip is attached to a coplanar transmission line with an integrated photoconductive switch. The switch is illuminated through a fiber which is rigidly attached to the switch...... waveguide. The measurements show that the probe works as a transient voltage detector in contact and a capacitively coupled transient field detector in tunneling mode. We do not measure the transient voltage change in the ohmic tunneling current. In this sense, the spatial resolution for propagating...... substrate. By using a firmly attached fiber we achieve an excellent reproducibility and unconstrained positioning of the tip. We observe a transient signal with 2.9 ps pulse width in tunneling mode and 5 ps in contact mode. The instrument is applied to investigating the mode structure on a coplanar...

  5. Light and scanning electron microscopic examination of hair in Garlic's syndrome

    International Nuclear Information System (INIS)

    Celik, Hakan H.; Tunali, S.; Tatar, I.; Aldur, Muhammad M.; Tore, H.

    2007-01-01

    Grisceli syndrome is a rare disease is a rare disease characterized by pigment dilution, partial albinism, variable cellular immunodeficiency and an acute phase of uncontrolled T-lymphocyte macrophage activation. Griscelli et al described this syndrome in 1978. Since then, only approximately, 60 cases have been reported, most from Turkish and Mediterranean population. In microscopic examination, silvery grey hair with large clumped melanosomes on the hair shaft is the diagnostic finding. Here, we present scanning electron microscopic study of hair in 2 cases of Griscelli syndrome where the hair showed normal cuticular pattern but nodular structures were present as an abnormal finding. (author)

  6. Scanning tunneling microscope with two-dimensional translator.

    Science.gov (United States)

    Nichols, J; Ng, K-W

    2011-01-01

    Since the invention of the scanning tunneling microscope (STM), it has been a powerful tool for probing the electronic properties of materials. Typically STM designs capable of obtaining resolution on the atomic scale are limited to a small area which can be probed. We have built an STM capable of coarse motion in two dimensions, the z- and x-directions which are, respectively, parallel and perpendicular to the tip. This allows us to image samples with very high resolution at sites separated by macroscopic distances. This device is a single unit with a compact design making it very stable. It can operate in either a horizontal or vertical configuration and at cryogenic temperatures.

  7. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

    International Nuclear Information System (INIS)

    Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Gruetter, Peter

    2011-01-01

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10 -10 mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.

  8. High contrast imaging and flexible photomanipulation for quantitative in vivo multiphoton imaging with polygon scanning microscope.

    Science.gov (United States)

    Li, Yongxiao; Montague, Samantha J; Brüstle, Anne; He, Xuefei; Gillespie, Cathy; Gaus, Katharina; Gardiner, Elizabeth E; Lee, Woei Ming

    2018-02-28

    In this study, we introduce two key improvements that overcome limitations of existing polygon scanning microscopes while maintaining high spatial and temporal imaging resolution over large field of view (FOV). First, we proposed a simple and straightforward means to control the scanning angle of the polygon mirror to carry out photomanipulation without resorting to high speed optical modulators. Second, we devised a flexible data sampling method directly leading to higher image contrast by over 2-fold and digital images with 100 megapixels (10 240 × 10 240) per frame at 0.25 Hz. This generates sub-diffraction limited pixels (60 nm per pixels over the FOV of 512 μm) which increases the degrees of freedom to extract signals computationally. The unique combined optical and digital control recorded fine fluorescence recovery after localized photobleaching (r ~10 μm) within fluorescent giant unilamellar vesicles and micro-vascular dynamics after laser-induced injury during thrombus formation in vivo. These new improvements expand the quantitative biological-imaging capacity of any polygon scanning microscope system. © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  9. Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process

    Science.gov (United States)

    Cui, Le; Marchand, Éric

    2015-04-01

    A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article. A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014. . Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.

  10. Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique

    DEFF Research Database (Denmark)

    Bariani, Paolo; De Chiffre, Leonardo; Hansen, Hans Nørgaard

    2005-01-01

    An investigation was carried out concerning the traceability of dimensional measurements performed with the scanning electron microscope (SEM) using reconstruction of surface topography through stereo-photogrammetry. A theoretical description of the effects that the main instrumental variables...... with the scanning electron microscope (SEM) using reconstruction of surface topography through stereo-photogrammetry. A theoretical description of the effects that the main instrumental variables and measurement parameters have on the reconstruction accuracy of any point on the surface of the object being imaged......-dimensional topography of the type C roughness standards showed good agreement with the nominal profile wavelength values. An investigation was carried out concerning the traceability of dimensional measurements performed with the scanning electron microscope (SEM) using reconstruction of surface topography through...

  11. Characterizing deformed ultrafine-grained and nanocrystalline materials using transmission Kikuchi diffraction in a scanning electron microscope

    International Nuclear Information System (INIS)

    Trimby, Patrick W.; Cao, Yang; Chen, Zibin; Han, Shuang; Hemker, Kevin J.; Lian, Jianshe; Liao, Xiaozhou; Rottmann, Paul; Samudrala, Saritha; Sun, Jingli; Wang, Jing Tao; Wheeler, John; Cairney, Julie M.

    2014-01-01

    Graphical abstract: -- Abstract: The recent development of transmission Kikuchi diffraction (TKD) in a scanning electron microscope enables fast, automated orientation mapping of electron transparent samples using standard electron backscatter diffraction (EBSD) hardware. TKD in a scanning electron microscope has significantly better spatial resolution than conventional EBSD, enabling routine characterization of nanocrystalline materials and allowing effective measurement of samples that have undergone severe plastic deformation. Combining TKD with energy dispersive X-ray spectroscopy (EDS) provides complementary chemical information, while a standard forescatter detector system below the EBSD detector can be used to generate dark field and oriented dark field images. Here we illustrate the application of this exciting new approach to a range of deformed, ultrafine grained and nanocrystalline samples, including duplex stainless steel, nanocrystalline copper and highly deformed titanium and nickel–cobalt. The results show that TKD combined with EDS is a highly effective and widely accessible tool for measuring key microstructural parameters at resolutions that are inaccessible using conventional EBSD

  12. Spatio-temporal imaging of voltage pulses with an ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Jensen, Jacob Riis; Keil, Ulrich Dieter Felix; Hvam, Jørn Märcher

    1997-01-01

    Measurements on an ultrafast scanning tunneling microscope with simultaneous spatial and temporal resolution are presented. We show images of picosecond pulses propagating on a coplanar waveguide and resolve their mode structures. The influence of transmission line discontinuities on the mode...

  13. Modeling of Electronic Transport in Scanning Tunneling Microscope Tip-Carbon Nanotube Systems

    Science.gov (United States)

    Yamada, Toshishige; Kwak, Dochan (Technical Monitor)

    2000-01-01

    A model is proposed for two observed current-voltage (I-V) patterns in a recent experiment with a scanning tunneling microscope tip and a carbon nanotube. We claim that there are two mechanical contact modes for a tip (metal) -nanotube (semiconductor) junction (1) with or (2) without a tiny vacuum gap (0.1 - 0.2 nm). With the tip grounded, the tunneling case in (1) would produce large dI/dV with V > 0, small dI/dV with V < 0, and I = 0 near V = 0 for an either n- or p-nanotube; the Schottky mechanism in (2) would result in I does not equal 0 only with V < 0 for an n-nanotube, and the bias polarities would be reversed for a p-nanotube. The two observed I-V patterns are thus entirely explained by a tip-nanotube contact of the two types, where the nanotube must be n-type.

  14. Conductance of single atoms and molecules studied with a scanning tunnelling microscope

    International Nuclear Information System (INIS)

    Neel, N; Kroeger, J; Limot, L; Berndt, R

    2007-01-01

    The conductance of single atoms and molecules is investigated with a low-temperature scanning tunnelling microscope. In a controlled and reproducible way, clean Ag(111) surfaces, individual silver atoms on Ag(111) as well as individual C 60 molecules adsorbed on Cu(100) are contacted with the tip of the microscope. Upon contact the conductance changes discontinuously in the case of the tip-surface junction while the tip-atom and tip-molecule junctions exhibit a continuous transition from the tunnelling to the contact regime

  15. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

    Directory of Open Access Journals (Sweden)

    Tobias Meier

    2015-02-01

    Full Text Available We describe an atomic force microscope (AFM for the characterization of self-sensing tunneling magnetoresistive (TMR cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.

  16. Nanomanipulation and nanofabrication with multi-probe scanning tunneling microscope: from individual atoms to nanowires.

    Science.gov (United States)

    Qin, Shengyong; Kim, Tae-Hwan; Wang, Zhouhang; Li, An-Ping

    2012-06-01

    The wide variety of nanoscale structures and devices demands novel tools for handling, assembly, and fabrication at nanoscopic positioning precision. The manipulation tools should allow for in situ characterization and testing of fundamental building blocks, such as nanotubes and nanowires, as they are built into functional devices. In this paper, a bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM). The applications of this technique are demonstrated in a variety of nanosystems, from manipulating individual atoms to bending, cutting, breaking carbon nanofibers, and constructing nanodevices for electrical characterizations. The combination of the wide field of view of SEM, the atomic position resolution of STM, and the flexibility of multiple scanning probes is expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.

  17. Modeling the hysteresis of a scanning probe microscope

    DEFF Research Database (Denmark)

    Dirscherl, Kai; Garnæs, Jørgen; Nielsen, L.

    2000-01-01

    Most scanning probe microscopes use piezoelectric actuators in open loop configurations. Therefore a major problem related to these instruments is the image distortion due to the hysteresis effect of the piezo. In order to eliminate the distortions, cost effective software control based on a model...... for hysteresis can be applied to the scanner. We describe a new rate-independent model for the hysteresis of a piezo scanner. Two reference standards were used to determine the accuracy of the model; a one-dimensional grating with a period of 3.0 mum and a two-dimensional grating with 200 nm pitch...

  18. Coupling auto trophic in vitro plant cultivation system to scanning electron microscope to study plant-fungal interactions

    Energy Technology Data Exchange (ETDEWEB)

    Jaeger, N. de; Decock, C.; Declereck, S.; Providencia, I. E. de la

    2010-07-01

    The interactions of plants with pathogens and beneficial micro-organisms have been seldom compared on the same host and under strict controlled auto trophic in vitro culture conditions. Here, the life cycle of two plant beneficial (Glomus sp. MUCL 41833 and Trichoderma harzianum) and one plant pathogen (Rhizoctonia solani) fungi were described on potato (Solanum tuberosum) plantlets under auto trophic in vitro culture conditions using video camera imaging and the scanning electron microscope (SEM). (i) The colony developmental pattern of the extraradical mycelium within the substrate, (ii) the reproduction structures and (iii) the three-dimensional spatial arrangements of the fungal hyphae within the potato root cells were successfully visualized, monitored and described. The combination of the autotrophic in vitro culture system and SEM represent a powerful tool for improving our knowledge on the dynamics of plant-fungal interactions. (Author) 41 refs.

  19. Study of Nb-oxide Nb-Pb film structures by tunnel scanning microscope

    International Nuclear Information System (INIS)

    Golyamina, E.M.; Troyanovskij, A.M.

    1986-01-01

    The surface of niobium films, which were earlier used to create niobium-niobium oxide-lead film structures on their base, was investigated, using tunnel scanning microscope. The results obtained agree well with the observed properties of these structures, containing josephson and tunnel junctions

  20. Imaging of surface plasmon polariton interference using phase-sensitive scanning tunneling microscope

    NARCIS (Netherlands)

    Jose, J.; Segerink, Franciscus B.; Korterik, Jeroen P.; Herek, Jennifer Lynn; Offerhaus, Herman L.

    2011-01-01

    We report the surface plasmon polariton interference, generated via a ‘buried’ gold grating, and imaged using a phase-sensitive Photon Scanning Tunneling Microscope (PSTM). The phase-resolved PSTM measurement unravels the complex surface plasmon polariton interference fields at the gold-air

  1. A high performance, cost-effective, open-source microscope for scanning two-photon microscopy that is modular and readily adaptable.

    Directory of Open Access Journals (Sweden)

    David G Rosenegger

    Full Text Available Two-photon laser scanning microscopy has revolutionized the ability to delineate cellular and physiological function in acutely isolated tissue and in vivo. However, there exist barriers for many laboratories to acquire two-photon microscopes. Additionally, if owned, typical systems are difficult to modify to rapidly evolving methodologies. A potential solution to these problems is to enable scientists to build their own high-performance and adaptable system by overcoming a resource insufficiency. Here we present a detailed hardware resource and protocol for building an upright, highly modular and adaptable two-photon laser scanning fluorescence microscope that can be used for in vitro or in vivo applications. The microscope is comprised of high-end componentry on a skeleton of off-the-shelf compatible opto-mechanical parts. The dedicated design enabled imaging depths close to 1 mm into mouse brain tissue and a signal-to-noise ratio that exceeded all commercial two-photon systems tested. In addition to a detailed parts list, instructions for assembly, testing and troubleshooting, our plan includes complete three dimensional computer models that greatly reduce the knowledge base required for the non-expert user. This open-source resource lowers barriers in order to equip more laboratories with high-performance two-photon imaging and to help progress our understanding of the cellular and physiological function of living systems.

  2. A High Performance, Cost-Effective, Open-Source Microscope for Scanning Two-Photon Microscopy that Is Modular and Readily Adaptable

    Science.gov (United States)

    Rosenegger, David G.; Tran, Cam Ha T.; LeDue, Jeffery; Zhou, Ning; Gordon, Grant R.

    2014-01-01

    Two-photon laser scanning microscopy has revolutionized the ability to delineate cellular and physiological function in acutely isolated tissue and in vivo. However, there exist barriers for many laboratories to acquire two-photon microscopes. Additionally, if owned, typical systems are difficult to modify to rapidly evolving methodologies. A potential solution to these problems is to enable scientists to build their own high-performance and adaptable system by overcoming a resource insufficiency. Here we present a detailed hardware resource and protocol for building an upright, highly modular and adaptable two-photon laser scanning fluorescence microscope that can be used for in vitro or in vivo applications. The microscope is comprised of high-end componentry on a skeleton of off-the-shelf compatible opto-mechanical parts. The dedicated design enabled imaging depths close to 1 mm into mouse brain tissue and a signal-to-noise ratio that exceeded all commercial two-photon systems tested. In addition to a detailed parts list, instructions for assembly, testing and troubleshooting, our plan includes complete three dimensional computer models that greatly reduce the knowledge base required for the non-expert user. This open-source resource lowers barriers in order to equip more laboratories with high-performance two-photon imaging and to help progress our understanding of the cellular and physiological function of living systems. PMID:25333934

  3. Electron spin resonance scanning tunneling microscope

    International Nuclear Information System (INIS)

    Guo Yang; Li Jianmei; Lu Xinghua

    2015-01-01

    It is highly expected that the future informatics will be based on the spins of individual electrons. The development of elementary information unit will eventually leads to novel single-molecule or single-atom devices based on electron spins; the quantum computer in the future can be constructed with single electron spins as the basic quantum bits. However, it is still a great challenge in detection and manipulation of a single electron spin, as well as its coherence and entanglement. As an ideal experimental tool for such tasks, the development of electron spin resonance scanning tunneling microscope (ESR-STM) has attracted great attention for decades. This paper briefly introduces the basic concept of ESR-STM. The development history of this instrument and recent progresses are reviewed. The underlying mechanism is explored and summarized. The challenges and possible solutions are discussed. Finally, the prospect of future direction and applications are presented. (authors)

  4. Design and operation of an inexpensive far-field laser scanning microscope suitable for use in an undergraduate laboratory course

    Science.gov (United States)

    Pallone, Arthur; Hawk, Eric

    2013-03-01

    Scanning microscope applications span the science disciplines yet their costs limit their use at educational institutions. The basic concepts of scanning microscopy are simple. The microscope probe - whether it produces a photon, electron or ion beam - moves relative to the surface of the sample object. The beam interacts with the sample to produce a detected signal that depends on the desired property to be measured at the probe location on the sample. The microscope transforms the signal for output in a form desired by the user. Undergraduate students can easily construct a far-field laser scanning microscope that illustrates each of these principles from parts available at local electronics and hardware stores and use the microscope to explore properties of devices such as light dependent resistors and biological samples such as leaves. Students can record, analyze and interpret results using a computer and free software.

  5. Examination of Scanning Electron Microscope and Computed Tomography Images of PICA

    Science.gov (United States)

    Lawson, John W.; Stackpoole, Margaret M.; Shklover, Valery

    2010-01-01

    Micrographs of PICA (Phenolic Impregnated Carbon Ablator) taken using a Scanning Electron Microscope (SEM) and 3D images taken with a Computed Tomography (CT) system are examined. PICA is a carbon fiber based composite (Fiberform ) with a phenolic polymer matrix. The micrographs are taken at different surface depths and at different magnifications in a sample after arc jet testing and show different levels of oxidative removal of the charred matrix (Figs 1 though 13). CT scans, courtesy of Xradia, Inc. of Concord CA, were captured for samples of virgin PICA, charred PICA and raw Fiberform (Fig. 14). We use these images to calculate the thermal conductivity (TC) of these materials using correlation function (CF) methods. CF methods give a mathematical description of how one material is embedded in another and is thus ideally suited for modeling composites like PICA. We will evaluate how the TC of the materials changes as a function of surface depth. This work is in collaboration with ETH-Zurich, which has expertise in high temperature materials and TC modeling (including CF methods).

  6. Phase zone plates as condensers for the Gottingen scanning x-ray microscope

    International Nuclear Information System (INIS)

    Hilkenbach, R.; Thieme

    1987-01-01

    With the Gottingen scanning x-ray microscope the synchrotron source is image by x-ray optics into a monochromatic small scan spot, through which a specimen can be moved. Hereby one part of the optics, the condenser zone plate and a pinhole, works as a linear monochromator in the wavelength region of λ = 2.36 nm to λ = 4.5 nm. The efficiency of such a condenser should be as high as possible to minimize the loss of radiation. Phase zone plates have a four times higher efficiency in the first order of diffraction than amplitude zone plates. Two condenser zone plates, KZP4 and KZP5, have been constructed so that they are well suited for the use in the scanning microscope. These zone plates have been made holographically by superposing two wavefronts of laser light in an specific designed optical arrangement and exposing the zone plate structure into a photoresist. Using reactive ion etching (RIE) the structure has been transformed into Germanium. The thickness of the zone plate has been chosen to show at λ = 2.36 nm a phase effect. The efficiency has been measured at the Berliner Elektronenspeircherring Gesellschaft fur Synchrotronstrahlung m.b.H., Berlin

  7. Sample mounting and transfer for coupling an ultrahigh vacuum variable temperature beetle scanning tunneling microscope with conventional surface probes

    International Nuclear Information System (INIS)

    Nafisi, Kourosh; Ranau, Werner; Hemminger, John C.

    2001-01-01

    We present a new ultrahigh vacuum (UHV) chamber for surface analysis and microscopy at controlled, variable temperatures. The new instrument allows surface analysis with Auger electron spectroscopy, low energy electron diffraction, quadrupole mass spectrometer, argon ion sputtering gun, and a variable temperature scanning tunneling microscope (VT-STM). In this system, we introduce a novel procedure for transferring a sample off a conventional UHV manipulator and onto a scanning tunneling microscope in the conventional ''beetle'' geometry, without disconnecting the heating or thermocouple wires. The microscope, a modified version of the Besocke beetle microscope, is mounted on a 2.75 in. outer diameter UHV flange and is directly attached to the base of the chamber. The sample is attached to a tripod sample holder that is held by the main manipulator. Under UHV conditions the tripod sample holder can be removed from the main manipulator and placed onto the STM. The VT-STM has the capability of acquiring images between the temperature range of 180--500 K. The performance of the chamber is demonstrated here by producing an ordered array of island vacancy defects on a Pt(111) surface and obtaining STM images of these defects

  8. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.

    Science.gov (United States)

    Hagedorn, Till; El Ouali, Mehdi; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

    2011-11-01

    A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p ≤10(-10) mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission. © 2011 American Institute of Physics

  9. Fabrication of silver tips for scanning tunneling microscope induced luminescence.

    Science.gov (United States)

    Zhang, C; Gao, B; Chen, L G; Meng, Q S; Yang, H; Zhang, R; Tao, X; Gao, H Y; Liao, Y; Dong, Z C

    2011-08-01

    We describe a reliable fabrication procedure of silver tips for scanning tunneling microscope (STM) induced luminescence experiments. The tip was first etched electrochemically to yield a sharp cone shape using selected electrolyte solutions and then sputter cleaned in ultrahigh vacuum to remove surface oxidation. The tip status, in particular the tip induced plasmon mode and its emission intensity, can be further tuned through field emission and voltage pulse. The quality of silver tips thus fabricated not only offers atomically resolved STM imaging, but more importantly, also allows us to perform challenging "color" photon mapping with emission spectra taken at each pixel simultaneously during the STM scan under relatively small tunnel currents and relatively short exposure time.

  10. Wave Optical Calculation of Probe Size in Low Energy Scanning Electron Microscope

    Czech Academy of Sciences Publication Activity Database

    Radlička, Tomáš

    2015-01-01

    Roč. 21, S4 (2015), s. 212-217 ISSN 1431-9276 R&D Projects: GA MŠk(CZ) LO1212 Institutional support: RVO:68081731 Keywords : scanning electron microscope * optical calculation Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.730, year: 2015

  11. Poly(diacetylene) Monolayers Studied with a Fluorescence Scanning Near-Field Optical Microscope

    NARCIS (Netherlands)

    Moers, Marco H.P.; Moers, M.H.P.; Gaub, Hermann E.; van Hulst, N.F.

    1994-01-01

    A novel and powerful method to study the optical properties of thin lipid films which a resolution superior to confocal microscopy is presented. With a scanning near-field optical microscope, fluorescence images of a Langmuir-Blodgett film of diethylene glycol diamine pentacosadiynoic amide are

  12. Design of a high-speed electrochemical scanning tunneling microscope.

    Science.gov (United States)

    Yanson, Y I; Schenkel, F; Rost, M J

    2013-02-01

    In this paper, we present a bottom-up approach to designing and constructing a high-speed electrochemical scanning tunneling microscope (EC-STM). Using finite element analysis (FEA) calculations of the frequency response of the whole mechanical loop of the STM, we analyzed several geometries to find the most stable one that could facilitate fast scanning. To test the FEA results, we conducted measurements of the vibration amplitudes using a prototype STM setup. Based on the FEA analysis and the measurement results, we identified the potentially most disturbing vibration modes that could impair fast scanning. By modifying the design of some parts of the EC-STM, we reduced the amplitudes as well as increased the resonance frequencies of these modes. Additionally, we designed and constructed an electrochemical flow-cell that allows STM imaging in a flowing electrolyte, and built a bi-potentiostat to achieve electrochemical potential control during the measurements. Finally, we present STM images acquired during high-speed imaging in air as well as in an electrochemical environment using our newly-developed EC-STM.

  13. Frequency Response of the Sample Vibration Mode in Scanning Probe Acoustic Microscope

    International Nuclear Information System (INIS)

    Ya-Jun, Zhao; Qian, Cheng; Meng-Lu, Qian

    2010-01-01

    Based on the interaction mechanism between tip and sample in the contact mode of a scanning probe acoustic microscope (SPAM), an active mass of the sample is introduced in the mass-spring model. The tip motion and frequency response of the sample vibration mode in the SPAM are calculated by the Lagrange equation with dissipation function. For the silicon tip and glass assemblage in the SPAM the frequency response is simulated and it is in agreement with the experimental result. The living myoblast cells on the glass slide are imaged at resonance frequencies of the SPAM system, which are 20kHz, 30kHz and 120kHz. It is shown that good contrast of SPAM images could be obtained when the system is operated at the resonance frequencies of the system in high and low-frequency regions

  14. Current status of the Scanning X-ray Microscope at the ESRF

    International Nuclear Information System (INIS)

    Barrett, Ray; Kaulich, Burkhard; Salome, Murielle; Susini, Jean

    2000-01-01

    A short description of the Scanning X-ray Microscope of the ESRF ID21 X-ray microscopy beamline is given and the consequences of the relatively wide operating energy range discussed. The current capabilities of the instrument are demonstrated through images and spectra recorded from a variety of pilot experiments, including X-ray fluorescence imaging, microdiffraction and XANES measurements

  15. Fluctuation Dominated Josephson Tunneling with a Scanning Tunneling Microscope

    International Nuclear Information System (INIS)

    Naaman, O.; Teizer, W.; Dynes, R. C.

    2001-01-01

    We demonstrate Josephson tunneling in vacuum tunnel junctions formed between a superconducting scanning tunneling microscope tip and a Pb film, for junction resistances in the range 50--300 k Omega. We show that the superconducting phase dynamics is dominated by thermal fluctuations, and that the Josephson current appears as a peak centered at small finite voltage. In the presence of microwave fields (f=15.0 GHz) the peak decreases in magnitude and shifts to higher voltages with increasing rf power, in agreement with theory

  16. A scanning Hall probe microscope for high resolution magnetic imaging down to 300 mK

    International Nuclear Information System (INIS)

    Khotkevych, V. V.; Bending, S. J.; Milosevic, M. V.

    2008-01-01

    We present the design, construction, and performance of a low-temperature scanning Hall probe microscope with submicron lateral resolution and a large scanning range. The detachable microscope head is mounted on the cold flange of a commercial 3 He-refrigerator (Oxford Instruments, Heliox VT-50) and operates between room temperature and 300 mK. It is fitted with a three-axis slip-stick nanopositioner that enables precise in situ adjustment of the probe location within a 6x6x7 mm 3 space. The local magnetic induction at the sample surface is mapped with an easily changeable microfabricated Hall probe [typically GsAs/AlGaAs or AlGaAs/InGaAs/GaAs Hall sensors with integrated scanning tunnel microscopy (STM) tunneling tips] and can achieve minimum detectable fields ≥10 mG/Hz 1/2 . The Hall probe is brought into very close proximity to the sample surface by sensing and controlling tunnel currents at the integrated STM tip. The instrument is capable of simultaneous tunneling and Hall signal acquisition in surface-tracking mode. We illustrate the potential of the system with images of superconducting vortices at the surface of a Nb thin film down to 372 mK, and also of labyrinth magnetic-domain patterns of an yttrium iron garnet film captured at room temperature.

  17. Fermi surface contours obtained from scanning tunneling microscope images around surface point defects

    International Nuclear Information System (INIS)

    Khotkevych-Sanina, N V; Kolesnichenko, Yu A; Van Ruitenbeek, J M

    2013-01-01

    We present a theoretical analysis of the standing wave patterns in scanning tunneling microscope (STM) images, which occur around surface point defects. We consider arbitrary dispersion relations for the surface states and calculate the conductance for a system containing a small-size tunnel contact and a surface impurity. We find rigorous theoretical relations between the interference patterns in the real-space STM images, their Fourier transforms and the Fermi contours of two-dimensional electrons. We propose a new method for reconstructing Fermi contours of surface electron states, directly from the real-space STM images around isolated surface defects. (paper)

  18. Possibilities and prospects of investigation of irradiated structural and fuel materials using scanning electron microscope PHILLIPS XL 30 ESEM-TMP installed in the hot cell

    International Nuclear Information System (INIS)

    Golovanov, V. N.; Novoselov, A.E.; Kuzmin, S.V.; Yakovlev, V. V.

    2005-01-01

    Scanning electron microscope Philips XL 30 ESEM - TMP with X-ray microanalysis system INCA has been installed at SSC RF RIAR. The microscope is placed in the hot cell. Monitoring and control system is installed in the operator's room. Irradiated specimens are supplied to the hot cell through the transport terminal and installed into the microscope by manipulators. Direct contact of the personnel with radioactive materials is impossible. In addition it is developed the system of remote placement of the irradiated specimens into the specimen chamber of microscope. The system includes a stage with three seats, holders for different types of specimens and equipment for their remote loading in the holders. (Author)

  19. Screening small-molecule compound microarrays for protein ligands without fluorescence labeling with a high-throughput scanning microscope.

    Science.gov (United States)

    Fei, Yiyan; Landry, James P; Sun, Yungshin; Zhu, Xiangdong; Wang, Xiaobing; Luo, Juntao; Wu, Chun-Yi; Lam, Kit S

    2010-01-01

    We describe a high-throughput scanning optical microscope for detecting small-molecule compound microarrays on functionalized glass slides. It is based on measurements of oblique-incidence reflectivity difference and employs a combination of a y-scan galvometer mirror and an x-scan translation stage with an effective field of view of 2 cm x 4 cm. Such a field of view can accommodate a printed small-molecule compound microarray with as many as 10,000 to 20,000 targets. The scanning microscope is capable of measuring kinetics as well as endpoints of protein-ligand reactions simultaneously. We present the experimental results on solution-phase protein reactions with small-molecule compound microarrays synthesized from one-bead, one-compound combinatorial chemistry and immobilized on a streptavidin-functionalized glass slide.

  20. Theoretical analysis of moiré fringe multiplication under a scanning electron microscope

    International Nuclear Information System (INIS)

    Li, Yanjie; Xie, Huimin; Chen, Pengwan; Zhang, Qingming

    2011-01-01

    In this study, theoretical analysis and experimental verification of fringe multiplication under a scanning electron microscope (SEM) are presented. Fringe multiplication can be realized by enhancing the magnification or the number of scanning lines under the SEM. A universal expression of the pitch of moiré fringes is deduced. To apply this method to deformation measurement, the calculation formulas of strain and displacement are derived. Compared to natural moiré, the displacement sensitivity is increased by fringe multiplication while the strain sensitivity may be retained or enhanced depending on the number of scanning lines used. The moiré patterns are formed by the interference of a 2000 lines mm −1 grating with the scanning lines of SEM, and the measured parameters of moiré fringes from experimental results agree well with theoretical analysis

  1. The sinusoidal lining cells in "normal" human liver. A scanning electron microscopic investigation

    DEFF Research Database (Denmark)

    Horn, T; Henriksen, Jens Henrik Sahl; Christoffersen, P

    1986-01-01

    The scanning electron microscopic was used to study the fenestrations of human liver sinusoids. Thirteen biopsies, where light microscopy and transmission electron microscopy revealed normal sinusoidal architecture, were investigated. The number of fenestrae was calculated in acinar zone 3...

  2. A cryogenic scanning laser microscope for investigation of dynamical states in long Josephson junctions

    DEFF Research Database (Denmark)

    Holm, Jesper; Mygind, Jesper

    1995-01-01

    on measurements on different oscillator samples, performed with a novel Cryogenic Scanning Laser Microscope (CSLM) having a spatial resolution of less than ±2.5 μm over a 500 μm×50 μm wide scanning area in the temperature range 2 K-300 K. Even though the dynamical states are extremely sensitive to external noise...... tunnel current is one of the most important internal junction parameters which together with the boundary conditions determine the dynamics, it is of vital importance to experimentally determine the current density throughout the entire junction with high spatial resolution. Here we report...... this microscope enables us to make stable in-situ measurements on operating Josephson junctions. Recent results are presented and discussed....

  3. Theory of life time measurements with the scanning electron microscope: steady state

    NARCIS (Netherlands)

    Berz, F.; Kuiken, H.K.

    1976-01-01

    A theoretical steady state analysis is given of the scanning electron microscope method of measuring bulk life time in diodes, where the plane of the junction is perpendicular to the surface. The current in the junction is obtained as a function of the beam power, the beam penetration into the

  4. Field-based scanning tunneling microscope manipulation of antimony dimers on Si(001)

    NARCIS (Netherlands)

    Rogge, S.; Timmerman, R.H.; Scholte, P.M.L.O.; Geerligs, L.J.; Salemink, H.W.M.

    2001-01-01

    The manipulation of antimony dimers, Sb2, on the silicon (001) surface by means of a scanning tunneling microscope (STM) has been experimentally investigated. Directed hopping of the Sb2 dimers due the STM tip can dominate over the thermal motion at temperatures between 300 and 500 K. Statistics on

  5. Making Mn substitutional impurities in InAs using a scanning tunneling microscope.

    Science.gov (United States)

    Song, Young Jae; Erwin, Steven C; Rutter, Gregory M; First, Phillip N; Zhitenev, Nikolai B; Stroscio, Joseph A

    2009-12-01

    We describe in detail an atom-by-atom exchange manipulation technique using a scanning tunneling microscope probe. As-deposited Mn adatoms (Mn(ad)) are exchanged one-by-one with surface In atoms (In(su)) to create a Mn surface-substitutional (Mn(In)) and an exchanged In adatom (In(ad)) by an electron tunneling induced reaction Mn(ad) + In(su) --> Mn(In) + In(ad) on the InAs(110) surface. In combination with density-functional theory and high resolution scanning tunneling microscopy imaging, we have identified the reaction pathway for the Mn and In atom exchange.

  6. Distinction of nuclear spin states with the scanning tunneling microscope.

    Science.gov (United States)

    Natterer, Fabian Donat; Patthey, François; Brune, Harald

    2013-10-25

    We demonstrate rotational excitation spectroscopy with the scanning tunneling microscope for physisorbed H(2) and its isotopes HD and D(2). The observed excitation energies are very close to the gas phase values and show the expected scaling with the moment of inertia. Since these energies are characteristic for the molecular nuclear spin states we are able to identify the para and ortho species of hydrogen and deuterium, respectively. We thereby demonstrate nuclear spin sensitivity with unprecedented spatial resolution.

  7. Fundamentals of overlay measurement and inspection using scanning electron-microscope

    Science.gov (United States)

    Kato, T.; Okagawa, Y.; Inoue, O.; Arai, K.; Yamaguchi, S.

    2013-04-01

    Scanning electron-microscope (SEM) has been successfully applied to CD measurement as promising tools for qualifying and controlling quality of semiconductor devices in in-line manufacturing process since 1985. Furthermore SEM is proposed to be applied to in-die overlay monitor in the local area which is too small to be measured by optical overlay measurement tools any more, when the overlay control limit is going to be stringent and have un-ignorable dependence on device pattern layout, in-die location, and singular locations in wafer edge, etc. In this paper, we proposed new overlay measurement and inspection system to make an effective use of in-line SEM image, in consideration of trade-off between measurement uncertainty and measurement pattern density in each SEM conditions. In parallel, we make it clear that the best hybrid overlay metrology is in considering each tool's technology portfolio.

  8. Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes

    International Nuclear Information System (INIS)

    Rau, E. I.; Orlikovskiy, N. A.; Ivanova, E. S.

    2012-01-01

    A new highly efficient design for semiconductor detectors of intermediate-energy electrons (1–50 keV) for application in scanning electron microscopes is proposed. Calculations of the response function of advanced detectors and control experiments show that the efficiency of the developed devices increases on average twofold, which is a significant positive factor in the operation of modern electron microscopes in the mode of low currents and at low primary electron energies.

  9. Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

    DEFF Research Database (Denmark)

    Thirstrup, C.; Sakurai, M.; Stokbro, Kurt

    1999-01-01

    Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-terminated Si(001) surfaces has been mapped spatially and analyzed spectroscopically in the visible spectral range. The light emission is based on a novel...

  10. Impedance measurements on Au microelectrodes using controlled atmosphere high temperature scanning probe microscope

    DEFF Research Database (Denmark)

    Wu, Yuehua; Hansen, Karin Vels; Jacobsen, Torben

    2011-01-01

    High temperature impedance measurements on Au microelectrodes deposited on polished yttria stabilized zirconia (YSZ) pellets were demonstrated using a newly designed controlled atmosphere high temperature scanning probe microscope (CAHT-SPM). Probes based on Pt0.8Ir0.2 were fabricated and employed...

  11. Scanning photoelectron microscope for nanoscale three-dimensional spatial-resolved electron spectroscopy for chemical analysis.

    Science.gov (United States)

    Horiba, K; Nakamura, Y; Nagamura, N; Toyoda, S; Kumigashira, H; Oshima, M; Amemiya, K; Senba, Y; Ohashi, H

    2011-11-01

    In order to achieve nondestructive observation of the three-dimensional spatially resolved electronic structure of solids, we have developed a scanning photoelectron microscope system with the capability of depth profiling in electron spectroscopy for chemical analysis (ESCA). We call this system 3D nano-ESCA. For focusing the x-ray, a Fresnel zone plate with a diameter of 200 μm and an outermost zone width of 35 nm is used. In order to obtain the angular dependence of the photoelectron spectra for the depth-profile analysis without rotating the sample, we adopted a modified VG Scienta R3000 analyzer with an acceptance angle of 60° as a high-resolution angle-resolved electron spectrometer. The system has been installed at the University-of-Tokyo Materials Science Outstation beamline, BL07LSU, at SPring-8. From the results of the line-scan profiles of the poly-Si/high-k gate patterns, we achieved a total spatial resolution better than 70 nm. The capability of our system for pinpoint depth-profile analysis and high-resolution chemical state analysis is demonstrated. © 2011 American Institute of Physics

  12. Micro-four-point probes in a UHV scanning electron microscope for in-situ surface-conductivity measurements

    DEFF Research Database (Denmark)

    Shiraki, I.; Nagao, T.; Hasegawa, S.

    2000-01-01

    For in-situ measurements of surface conductivity in ultrahigh vacuum (UHV), we have installed micro-four-point probes (probe spacings down to 4 mum) in a UHV scanning electron microscope (SEM) combined with scanning reflection-high-energy electron diffraction (RHEED). With the aid of piezoactuators...

  13. Visualizing Morphological Changes of Abscission Zone Cells in Arabidopsis by Scanning Electron Microscope.

    Science.gov (United States)

    Shi, Chun-Lin; Butenko, Melinka A

    2018-01-01

    Scanning electron microscope (SEM) is a type of electron microscope which produces detailed images of surface structures. It has been widely used in plants and animals to study cellular structures. Here, we describe a detailed protocol to prepare samples of floral abscission zones (AZs) for SEM, as well as further image analysis. We show that it is a powerful tool to detect morphologic changes at the cellular level during the course of abscission in wild-type plants and to establish the details of phenotypic alteration in abscission mutants.

  14. Imaging of current density distributions with a Nb weak-link scanning nano-SQUID microscope

    Science.gov (United States)

    Shibata, Yusuke; Nomura, Shintaro; Kashiwaya, Hiromi; Kashiwaya, Satoshi; Ishiguro, Ryosuke; Takayanagi, Hideaki

    2015-10-01

    Superconducting quantum interference devices (SQUIDs) are accepted as one of the highest magnetic field sensitive probes. There are increasing demands to image local magnetic fields to explore spin properties and current density distributions in a two-dimensional layer of semiconductors or superconductors. Nano-SQUIDs have recently attracting much interest for high spatial resolution measurements in nanometer-scale samples. Whereas weak-link Dayem Josephson junction nano-SQUIDs are suitable to miniaturization, hysteresis in current-voltage (I-V) characteristics that is often observed in Dayem Josephson junction is not desirable for a scanning microscope. Here we report on our development of a weak-link nano-SQUIDs scanning microscope with small hysteresis in I-V curve and on reconstructions of two-dimensional current density vector in two-dimensional electron gas from measured magnetic field.

  15. Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope.

    Science.gov (United States)

    Nazin, G V; Wu, S W; Ho, W

    2005-06-21

    The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks corresponding to the individual vibronic states depends on the relative electron tunneling rates through the two barriers of the junction, as found by varying the vacuum gap tunneling rate by changing the height of the scanning tunneling microscope tip above the molecule. A simple, sequential tunneling model explains the observed trends.

  16. Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement.

    Science.gov (United States)

    Ge, Jian-Feng; Liu, Zhi-Long; Gao, Chun-Lei; Qian, Dong; Liu, Canhua; Jia, Jin-Feng

    2015-05-01

    Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO3 surface.

  17. Development of micro-four-point probe in a scanning tunneling microscope for in situ electrical transport measurement

    Energy Technology Data Exchange (ETDEWEB)

    Ge, Jian-Feng; Liu, Zhi-Long; Gao, Chun-Lei; Qian, Dong; Liu, Canhua, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn; Jia, Jin-Feng, E-mail: canhualiu@sjtu.edu.cn, E-mail: jfjia@sjtu.edu.cn [Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, 800 Dongchuan Road, Shanghai 200240 (China)

    2015-05-15

    Electrons at surface may behave differently from those in bulk of a material. Multi-functional tools are essential in comprehensive studies on a crystal surface. Here, we developed an in situ microscopic four-point probe (4PP) transport measurement system on the basis of a scanning tunneling microscope (STM). In particular, convenient replacement between STM tips and micro-4PPs enables systematic investigations of surface morphology, electronic structure, and electrical transport property of a same sample surface. Performances of the instrument are demonstrated with high-quality STM images, tunneling spectra, and low-noise electrical I-V characteristic curves of a single-layer FeSe film grown on a conductive SrTiO{sub 3} surface.

  18. X-ray analysis of a single aerosol particle with combination of scanning electron microscope and synchrotron radiation X-ray microscope

    International Nuclear Information System (INIS)

    Toyoda, Masatoshi; Kaibuchi, Kazuki; Nagasono, Mitsuru; Terada, Yasuko; Tanabe, Teruo; Hayakawa, Shinjiro; Kawai, Jun

    2004-01-01

    We developed a microscope by a combination of synchrotron radiation X-ray fluorescence (SR-XRF) microscope and scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDX). SR-XRF is appropriate to detect trace and micro amount of elements and sensitive to heavy elements in an analyte but it cannot observe the real time image. SEM-EDX can observe the secondary electron image of a single particle in real time and is appropriate to detect lighter elements. This combination microscope can ensure the identification of the XRF spectrum to the SEM image without transferring the sample. For aerosol analysis, it is important to analyze each particle. The present method makes feasible to analyze not only the average elemental composition as the total particles but also elemental composition of each particle, which is dependent on the particle shape and size. The microscope was applied to an individual aerosol particle study. The X-ray spectra were different among the particles, but also different between SR-XRF and SEM-EDX for the same particle, due to the difference in fluorescence yields between X-ray excitation and electron excitation

  19. Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Mark Schulz

    2011-08-01

    Full Text Available Nanothread with a diameter as small as one hundred nanometers was manufactured under a scanning electron microscope. Made directly from carbon nanotubes, and inheriting their superior electrical and mechanical properties, nanothread may be the world’s smallest man-made fiber. The smallest thread that can be spun using a bench-top spinning machine is about 5 microns in diameter. Nanothread is a new material building block that can be used at the nanoscale or plied to form yarn for applications at the micro and macro scales. Preliminary electrical and mechanical properties of nanothread were measured. The resistivity of nanothread is less than 10−5 Ω∙m. The strength of nanothread is greater than 0.5 GPa. This strength was obtained from measurements using special glue that cures in an electron microscope. The glue weakened the thread, thus further work is needed to obtain more accurate measurements. Nanothread will have broad applications in enabling electrical components, circuits, sensors, and tiny machines. Yarn can be used for various macroscale applications including lightweight antennas, composites, and cables.

  20. Recommendations for the design and the installation of large laser scanning microscopy systems

    Science.gov (United States)

    Helm, P. Johannes

    2012-03-01

    Laser Scanning Microscopy (LSM) has since the inventions of the Confocal Scanning Laser Microscope (CLSM) and the Multi Photon Laser Scanning Microscope (MPLSM) developed into an essential tool in contemporary life science and material science. The market provides an increasing number of turn-key and hands-off commercial LSM systems, un-problematic to purchase, set up and integrate even into minor research groups. However, the successful definition, financing, acquisition, installation and effective use of one or more large laser scanning microscopy systems, possibly of core facility character, often requires major efforts by senior staff members of large academic or industrial units. Here, a set of recommendations is presented, which are helpful during the process of establishing large systems for confocal or non-linear laser scanning microscopy as an effective operational resource in the scientific or industrial production process. Besides the description of technical difficulties and possible pitfalls, the article also illuminates some seemingly "less scientific" processes, i.e. the definition of specific laboratory demands, advertisement of the intention to purchase one or more large systems, evaluation of quotations, establishment of contracts and preparation of the local environment and laboratory infrastructure.

  1. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope.

    Science.gov (United States)

    Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

    2016-08-01

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  2. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Li, Meng; Xu, Chunkai, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn; Zhang, Panke; Li, Zhean; Chen, Xiangjun, E-mail: xuck@ustc.edu.cn, E-mail: xjun@ustc.edu.cn [Hefei National Laboratory for Physical Science at Microscale and Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China and Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026 (China)

    2016-08-15

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  3. Note: Electron energy spectroscopy mapping of surface with scanning tunneling microscope

    International Nuclear Information System (INIS)

    Li, Meng; Xu, Chunkai; Zhang, Panke; Li, Zhean; Chen, Xiangjun

    2016-01-01

    We report a novel scanning probe electron energy spectrometer (SPEES) which combines a double toroidal analyzer with a scanning tunneling microscope to achieve both topography imaging and electron energy spectroscopy mapping of surface in situ. The spatial resolution of spectroscopy mapping is determined to be better than 0.7 ± 0.2 μm at a tip sample distance of 7 μm. Meanwhile, the size of the field emission electron beam spot on the surface is also measured, and is about 3.6 ± 0.8 μm in diameter. This unambiguously demonstrates that the spatial resolution of SPEES technique can be much better than the size of the incident electron beam.

  4. Force Measurement with a Piezoelectric Cantilever in a Scanning Force Microscope

    OpenAIRE

    Tansock, J.; Williams, C. C.

    1992-01-01

    Detection of surface forces between a tip and sample has been demonstrated with a piezoelectric cantilever in a scanning force microscope (SFM). The use of piezoelectric force sensing is particularly advantageous in semiconductor applications where stray light from conventional optical force-sensing methods can significantly modify the local carrier density. Additionally, the piezoelectric sensors are simple, provide good sensitivity to force, and can be batch fabricated. Our piezoelectric fo...

  5. Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope.

    Science.gov (United States)

    Hanzelka, Pavel; Vonka, Jakub; Musilova, Vera

    2013-08-01

    We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance.

  6. Histological evaluation of thyroid lesions using a scanning acoustic microscope

    Directory of Open Access Journals (Sweden)

    Miura K

    2014-02-01

    Full Text Available Katsutoshi Miura,1 Hiroyuki Mineta2 1Department of Health Science, Pathology, and Anatomy, 2Department of Otorhinolaryngology, Hamamatsu University School of Medicine, Hamamatsu, Japan Purpose: A scanning acoustic microscope (SAM uses an ultrasound to image an object by plotting the speed-of-sound (SOS through tissues on screen. Because hard tissues result in great SOS, SAM can provide data on the tissue elasticity. This paper investigated the utility of SAM in evaluating thyroid lesions. Methods: Formalin-fixed, paraffin sections were scanned with a 120 MHz transducer. SOS through each area was calculated and plotted on the screen to provide histological images, and SOS of each lesion was compared and statistically analyzed. Results: High-concentrated colloids, red blood cells, and collagen fibers showed great SOS, while low-concentrated colloids, parathyroids, lymph follicles, and epithelial tissues including carcinomas demonstrated lower SOS. SAM clearly discriminated structure of thyroid components corresponding to low magnification of light microscopy. Thyroid tumors were classified into three groups by average SOS: the fast group consisted of follicular adenomas/carcinomas and malignant lymphomas; the slow group contained poorly differentiated/undifferentiated carcinomas; and the intermediate group comprised papillary/medullary carcinomas. Fragmented colloids, irregular-shaped follicles, and desmoplastic reactions were observed in the invasive area of surrounding carcinomas. Conclusion: The SAM imaging method had the following benefits: 1 precise images were acquired in a few minutes without special staining; 2 structural irregularity and desmoplastic reactions, which indicated malignancy, were detected; 3 images reflected tissue elasticity, which was statistically comparable among lesions by SOS; 4 follicular functional activity was predictable by converting colloid concentration to SOS; and 5 tumor classification was predictable by SOS

  7. Cathodoluminescence in the scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kociak, M., E-mail: mathieu.kociak@u-psud.fr [Laboratoire de Physique des Solides, Université Paris-SudParis-Sud, CNRS-UMR 8502, Orsay 91405 (France); Zagonel, L.F. [“Gleb Wataghin” Institute of Physics University of Campinas - UNICAMP, 13083-859 Campinas, São Paulo (Brazil)

    2017-05-15

    Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning transmission electron microscopy (STEM) has demonstrated great success in unveiling new physics in the field of plasmonics and quantum emitters. Most of these results were not imaginable even twenty years ago, due to conceptual and technical limitations. The purpose of this review is to present the recent advances that broke these limitations, and the new possibilities offered by the modern STEM-CL technique. We first introduce the different STEM-CL operating modes and the technical specificities in STEM-CL instrumentation. Two main classes of optical excitations, namely the coherent one (typically plasmons) and the incoherent one (typically light emission from quantum emitters) are investigated with STEM-CL. For these two main classes, we describe both the physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments. We then compare STEM-CL with its better known sister techniques: scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy. We finish by comprehensively reviewing recent STEM-CL applications. - Highlights: • Reviews the field of STEM-CL. • Introduces the technical requirements and challenges for STEM-CL. • Introduces the different types of excitations probed by STEM-CL. • Gives comprehensive overview of the last fifteenth years in the field.

  8. Characteristic Study of the Al 6061 T-6 used in RTP Primary Cooling System Using Scanning Electron Microscope (SEM)

    International Nuclear Information System (INIS)

    Tonny Anak Lanyau; Yusof Abdullah; Tom, P.P.

    2011-01-01

    Reactor TRIGA PUSPATI (RTP) is the only nuclear research reactor in Malaysia. Since the first criticality on 28th June 1982, RTP has been going through the safe operation and well maintenance. Along the period of operation almost 30 years, some of the reactor system and component has been refurbished, upgraded and replaced to ensure the functionality and safety to the reactor itself as well as to protect personnel and environment. Primary cooling system is to provide the sufficient cooling to the reactor by removal of the heat generated in the reactor core through the heat transfer process in the heat exchanger. In 2009, RTP has been undergoing the primary cooling system upgrades. Primary cooling system components including aluminium pipes has been dismantled and replaced with the new system. As a part of the ageing management programme and radiation damage study, the disposed aluminum pipes were taken and used in this study. Scanning Electron Microscope (SEM) is used to study the surface topography and elemental composition in conjunction of energy dispersive x-ray spectroscopy analysis. This paper presents the study that has been conducted. (author)

  9. Characterization of coating probe with Ti-DLC for electrical scanning probe microscope

    International Nuclear Information System (INIS)

    Shia Xiaolei; Guo Liqiu; Bai Yang; Qiao Lijie

    2011-01-01

    In electrical scanning probe microscope (ESPM) applications, the wear and conductivity of the probe are undoubtedly serious concerns since they affect the integrity of the measurements. This study investigates the characterization of Ti doped diamond-like-carbon (DLC) as coating material on a silicon cantilever for ESPM. We deposited a layer of Ti-DLC thin film on the surface of Si cantilever by magnetron sputtering. The morphology and composition of the Ti-DLC films were characterized by scanning electron microscopy and Raman spectroscopy, respectively. We also compared the wear resistance, electric conductivity and scanning image quality of the Ti-DLC-coated probes with those of commercially available conductive probes. The results showed that the electric conductivity and the scanning image quality of the Ti-DLC-coated probes were the same as the commercial conductive probes, while the wear resistance and service life was significantly better.

  10. A near-field scanning microwave microscope based on a superconducting resonator for low power measurements.

    Science.gov (United States)

    de Graaf, S E; Danilov, A V; Adamyan, A; Kubatkin, S E

    2013-02-01

    We report on the design and performance of a cryogenic (300 mK) near-field scanning microwave microscope. It uses a microwave resonator as the near-field sensor, operating at a frequency of 6 GHz and microwave probing amplitudes down to 100 μV, approaching low enough photon population (N ∼ 1000) of the resonator such that coherent quantum manipulation becomes feasible. The resonator is made out of a miniaturized distributed fractal superconducting circuit that is integrated with the probing tip, micromachined to be compact enough such that it can be mounted directly on a quartz tuning-fork, and used for parallel operation as an atomic force microscope (AFM). The resonator is magnetically coupled to a transmission line for readout, and to achieve enhanced sensitivity we employ a Pound-Drever-Hall measurement scheme to lock to the resonance frequency. We achieve a well localized near-field around the tip such that the microwave resolution is comparable to the AFM resolution, and a capacitive sensitivity down to 6.4 × 10(-20) F/Hz, limited by mechanical noise. We believe that the results presented here are a significant step towards probing quantum systems at the nanoscale using near-field scanning microwave microscopy.

  11. Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope

    Directory of Open Access Journals (Sweden)

    Sadegh Mehdi Aghaei

    2015-01-01

    Full Text Available Line nanopatterns are produced on the positive photoresist by scanning near-field optical microscope (SNOM. A laser diode with a wavelength of 450 nm and a power of 250 mW as the light source and an aluminum coated nanoprobe with a 70 nm aperture at the tip apex have been employed. A neutral density filter has been used to control the exposure power of the photoresist. It is found that the changes induced by light in the photoresist can be detected by in situ shear force microscopy (ShFM, before the development of the photoresist. Scanning electron microscope (SEM images of the developed photoresist have been used to optimize the scanning speed and the power required for exposure, in order to minimize the final line width. It is shown that nanometric lines with a minimum width of 33 nm can be achieved with a scanning speed of 75 µm/s and a laser power of 113 mW. It is also revealed that the overexposure of the photoresist by continuous wave laser generated heat can be prevented by means of proper photoresist selection. In addition, the effects of multiple exposures of nanopatterns on their width and depth are investigated.

  12. Surface characterization of superconductive Nd1Ba2Cu3Oy thin films using scanning probe microscopes

    International Nuclear Information System (INIS)

    Ting, W.; Badaye, M.; Itti, R.; Morishita, T.; Koshizuka, N.; Tanaka, S.

    1996-01-01

    Recently, superconductive Nd 1 Ba 2 Cu 3 O y (Nd123) thin films with high superconducting transition temperature (T c ) have been successfully fabricated at the authors institute employing the standard laser ablation method. In this paper, they report parts of the results of surface characterization of the Nd123 thin films using an ultrahigh vacuum scanning tunneling microscope/spectroscopy (UHV-STM/STS) and an atomic force microscope (AFM) system operated in air. Clear spiral pattern is observed on the surfaces of Nd123 thin films by STM and AFM, suggesting that films are formed by two-dimensional island growth mode at the final growing stage. Contour plots of the spirals show that the step heights of the spirals are not always the integer or half integer numbers of the c-axis parameter of the structure. This implies that the surface natural termination layer of the films may not be unique. Surface atomic images of the as-prepared Nd123 thin films are obtained employing both STM and AFM. STS measurements show that most of the surfaces are semiconductive, or sometimes even metallic. The results of STS measurements together with the fact that they are able to see the surface atomic images using scanning probe microscopes suggest that exposure to air does not cause serious degradation to the as-prepared surfaces of Nd123 thin films

  13. Scanning tunnelling microscope imaging of nanoscale electron density gradients on the surface of GaAs

    International Nuclear Information System (INIS)

    Hamilton, B; Jacobs, J; Missous, M

    2003-01-01

    This paper is concerned with the scanning tunnelling microscope tunnelling conditions needed to produce constant current images dominated either by surface topology or by electronic effects. A model experimental structure was produced by cleaving a GaAs multiδ-doped layer in UHV and so projecting a spatially varying electron gas density onto the (110) surface. This cross sectional electron density varies on a nanometre scale in the [100] growth direction. The electronic structure and tunnelling properties of this system were modelled, and the tunnelling conditions favouring sensitivity to the surface electron gas density determined

  14. Observation of magnetic domains using a reflection mode scanning near-field optical microscope

    NARCIS (Netherlands)

    Durkam, C.; Shvets, I.V.; Lodder, J.C.

    1997-01-01

    It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of

  15. Measurements with an ultrafast scanning tunnelling microscope on photoexcited semiconductor layers

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1998-01-01

    Summary form only given. We demonstrate the use of a ultrafast scanning tunnelling microscopes (USTM) for detecting laser-induced field transients on semiconductor layers. In principle, the instrument can detect transient field changes thus far observed as far-field THz radiation in the near......-field regime and resolve small signal sources. For photoexcited low temperature (LT) GaAs we can explain the signal by a diffusion current driven by the laser-induced carrier density gradient...

  16. Scanning magnetic tunnel junction microscope for high-resolution imaging of remanent magnetization fields

    Science.gov (United States)

    Lima, E. A.; Bruno, A. C.; Carvalho, H. R.; Weiss, B. P.

    2014-10-01

    Scanning magnetic microscopy is a new methodology for mapping magnetic fields with high spatial resolution and field sensitivity. An important goal has been to develop high-performance instruments that do not require cryogenic technology due to its high cost, complexity, and limitation on sensor-to-sample distance. Here we report the development of a low-cost scanning magnetic microscope based on commercial room-temperature magnetic tunnel junction (MTJ) sensors that typically achieves spatial resolution better than 7 µm. By comparing different bias and detection schemes, optimal performance was obtained when biasing the MTJ sensor with a modulated current at 1.0 kHz in a Wheatstone bridge configuration while using a lock-in amplifier in conjunction with a low-noise custom-made preamplifier. A precision horizontal (x-y) scanning stage comprising two coupled nanopositioners controls the position of the sample and a linear actuator adjusts the sensor-to-sample distance. We obtained magnetic field sensitivities better than 150 nT/Hz1/2 between 0.1 and 10 Hz, which is a critical frequency range for scanning magnetic microscopy. This corresponds to a magnetic moment sensitivity of 10-14 A m2, a factor of 100 better than achievable with typical commercial superconducting moment magnetometers. It also represents an improvement in sensitivity by a factor between 10 and 30 compared to similar scanning MTJ microscopes based on conventional bias-detection schemes. To demonstrate the capabilities of the instrument, two polished thin sections of representative geological samples were scanned along with a synthetic sample containing magnetic microparticles. The instrument is usable for a diversity of applications that require mapping of samples at room temperature to preserve magnetic properties or viability, including paleomagnetism and rock magnetism, nondestructive evaluation of materials, and biological assays.

  17. Scanning magnetic tunnel junction microscope for high-resolution imaging of remanent magnetization fields

    International Nuclear Information System (INIS)

    Lima, E A; Weiss, B P; Bruno, A C; Carvalho, H R

    2014-01-01

    Scanning magnetic microscopy is a new methodology for mapping magnetic fields with high spatial resolution and field sensitivity. An important goal has been to develop high-performance instruments that do not require cryogenic technology due to its high cost, complexity, and limitation on sensor-to-sample distance. Here we report the development of a low-cost scanning magnetic microscope based on commercial room-temperature magnetic tunnel junction (MTJ) sensors that typically achieves spatial resolution better than 7 µm. By comparing different bias and detection schemes, optimal performance was obtained when biasing the MTJ sensor with a modulated current at 1.0 kHz in a Wheatstone bridge configuration while using a lock-in amplifier in conjunction with a low-noise custom-made preamplifier. A precision horizontal (x–y) scanning stage comprising two coupled nanopositioners controls the position of the sample and a linear actuator adjusts the sensor-to-sample distance. We obtained magnetic field sensitivities better than 150 nT/Hz 1/2 between 0.1 and 10 Hz, which is a critical frequency range for scanning magnetic microscopy. This corresponds to a magnetic moment sensitivity of 10 –14  A m 2 , a factor of 100 better than achievable with typical commercial superconducting moment magnetometers. It also represents an improvement in sensitivity by a factor between 10 and 30 compared to similar scanning MTJ microscopes based on conventional bias-detection schemes. To demonstrate the capabilities of the instrument, two polished thin sections of representative geological samples were scanned along with a synthetic sample containing magnetic microparticles. The instrument is usable for a diversity of applications that require mapping of samples at room temperature to preserve magnetic properties or viability, including paleomagnetism and rock magnetism, nondestructive evaluation of materials, and biological assays. (paper)

  18. Study of skin of an Egyptian mummy using a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Mańkowska-Pliszka Hanna

    2017-06-01

    Full Text Available The first study of modified human remains using an electron microscope was carried out at the end of the 1950 and in 1979 the first result of the study involving a scanning electron microscope (SEM was published for the first time. The study was mainly focused on the structure of tissues and cells. With the help of this technique cell and tissue elements, viruses and bacterial endospores as well as the structure of epithelium and the collagen contents of dermis were identified and described. In the above-mentioned case the object of the study using a SEM was a free part of the right hand (forearm with the dorsal and palmar parts of hand of unknown origin, with signs of mummification revealed during microscopic analysis. Our study was aimed at finding the answer to the question if the mummification of the studied limb was natural or intentional, and if the study using a SEM could link the anonymous remains with ancient Egypt.

  19. Characteristics of different frequency ranges in scanning electron microscope images

    International Nuclear Information System (INIS)

    Sim, K. S.; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S.

    2015-01-01

    We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement

  20. Characteristics of different frequency ranges in scanning electron microscope images

    Energy Technology Data Exchange (ETDEWEB)

    Sim, K. S., E-mail: kssim@mmu.edu.my; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S. [Faculty of Engineering and Technology, Multimedia University, 75450 Melaka (Malaysia)

    2015-07-22

    We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement.

  1. Macro-SICM: A Scanning Ion Conductance Microscope for Large-Range Imaging.

    Science.gov (United States)

    Schierbaum, Nicolas; Hack, Martin; Betz, Oliver; Schäffer, Tilman E

    2018-04-17

    The scanning ion conductance microscope (SICM) is a versatile, high-resolution imaging technique that uses an electrolyte-filled nanopipet as a probe. Its noncontact imaging principle makes the SICM uniquely suited for the investigation of soft and delicate surface structures in a liquid environment. The SICM has found an ever-increasing number of applications in chemistry, physics, and biology. However, a drawback of conventional SICMs is their relatively small scan range (typically 100 μm × 100 μm in the lateral and 10 μm in the vertical direction). We have developed a Macro-SICM with an exceedingly large scan range of 25 mm × 25 mm in the lateral and 0.25 mm in the vertical direction. We demonstrate the high versatility of the Macro-SICM by imaging at different length scales: from centimeters (fingerprint, coin) to millimeters (bovine tongue tissue, insect wing) to micrometers (cellular extensions). We applied the Macro-SICM to the study of collective cell migration in epithelial wound healing.

  2. Evaluation of a completely robotized neurosurgical operating microscope.

    Science.gov (United States)

    Kantelhardt, Sven R; Finke, Markus; Schweikard, Achim; Giese, Alf

    2013-01-01

    Operating microscopes are essential for most neurosurgical procedures. Modern robot-assisted controls offer new possibilities, combining the advantages of conventional and automated systems. We evaluated the prototype of a completely robotized operating microscope with an integrated optical coherence tomography module. A standard operating microscope was fitted with motors and control instruments, with the manual control mode and balance preserved. In the robot mode, the microscope was steered by a remote control that could be fixed to a surgical instrument. External encoders and accelerometers tracked microscope movements. The microscope was additionally fitted with an optical coherence tomography-scanning module. The robotized microscope was tested on model systems. It could be freely positioned, without forcing the surgeon to take the hands from the instruments or avert the eyes from the oculars. Positioning error was about 1 mm, and vibration faded in 1 second. Tracking of microscope movements, combined with an autofocus function, allowed determination of the focus position within the 3-dimensional space. This constituted a second loop of navigation independent from conventional infrared reflector-based techniques. In the robot mode, automated optical coherence tomography scanning of large surface areas was feasible. The prototype of a robotized optical coherence tomography-integrated operating microscope combines the advantages of a conventional manually controlled operating microscope with a remote-controlled positioning aid and a self-navigating microscope system that performs automated positioning tasks such as surface scans. This demonstrates that, in the future, operating microscopes may be used to acquire intraoperative spatial data, volume changes, and structural data of brain or brain tumor tissue.

  3. Scanning tunnel microscopic image of tungsten (100) and (110) real surfaces and nature of conduction electron reflection

    International Nuclear Information System (INIS)

    Pryadkin, S.L.; Tsoj, V.S.

    1988-01-01

    The electrically polished (100) and (110) surfaces of tungsten are studied with the aid of a scanning tunnel microscope at atmospheric pressure. The (110) surface consists of a large number of atomically plane terraces whereas the (100) surface is faceted. The scanning tunnel microscope data can explain such results of experiments on transverse electron focussing as the strong dependence of the probability for specular reflection of conduction electrons scattered by the (100) surface on the electron de Broglie wavelength and the absence of a dependence of the probability for specular reflection on the wavelength for the (110) surface

  4. A multipurpose hybrid conventional/scanning near-field optical microscope for applications in materials science and biology

    International Nuclear Information System (INIS)

    Longo, G; Girasole, M; Pompeo, G; Generosi, R; Luce, M; Cricenti, A

    2010-01-01

    A hybrid conventional/scanning near-field optical microscope is presented. The instrument is obtained coupling an Olympus IX-70 inverted optical microscope with a SNOM head, to combine the versatility and ease of use of the conventional microscope with the high-resolution and three-dimensional reconstruction achieved by the SNOM. The head can be run in shear or tapping mode and is optimized to characterize soft, biological samples including living cells in physiological environment by including the SNOM in a cylindrical chamber that insulates it from external noise, while maintaining a controlled temperature and atmosphere

  5. Chiral Majorana fermion modes regulated by a scanning tunneling microscope tip

    Science.gov (United States)

    Zhou, Yan-Feng; Hou, Zhe; Zhang, Ying-Tao; Sun, Qing-Feng

    2018-03-01

    The Majorana fermion can be described by a real wave function with only two phases (zero and π ) which provide a controllable degree of freedom. We propose a strategy to regulate the phase of the chiral Majorana state by coupling with a scanning tunneling microscope tip in a system consisting of a quantum anomalous Hall insulator coupled with a superconductor. With the change in the chemical potential, the chiral Majorana state can be tuned alternately between zero and π , in which the perfect normal tunneling and perfect crossed Andreev reflection appear, respectively. The perfect crossed Andreev reflection, by which a Cooper pair can be split into two electrons going into different terminals completely, leads to a pumping current and distinct quantized resistances. These findings may provide a signature of Majorana fermions and pave a feasible avenue to regulate the phase of the Majorana state.

  6. A simple, ultrahigh vacuum compatible scanning tunneling microscope for use at variable temperatures

    NARCIS (Netherlands)

    Mugele, Friedrich Gunther; Kloos, Ch.; Leiderer, P.; Moller, R.

    1996-01-01

    We present the construction of a very compact scanning tunneling microscope (STM) which can be operated at temperatures between 4 and 350 K. The tip and a tiny tip holder are the only movable parts, whereas the sample and the piezoscanner are rigidly attached to the body of the STM. This leads to an

  7. Contact detection for nanomanipulation in a scanning electron microscope

    International Nuclear Information System (INIS)

    Ru, Changhai; To, Steve

    2012-01-01

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000× magnification while inducing little end-effector damage. -- Highlights: ► We presents a simple method for obtaining the depth information in SEM-based nanomanipulation. ► Detecting contact between an end-effector and a target surface using SEM as a vision sensor. ► Additional touch/force sensors or specialized hardware need not be added. ► Achieved high repeatability and accuracy. ► Complete automatic contact detection within typically 60 s.

  8. Microscopic measurement of penetration depth in YBa2Cu3O7-δ thin films by scanning Hall probe microscopy

    International Nuclear Information System (INIS)

    Oral, A.; Bending, S.J.; Humphreys, R.G.; Henini, M.

    1997-01-01

    We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a YBa 2 Cu 3 O 7-δ thin film as a function of temperature. The instrument has high magnetic field (approx. 2.9x10 -8 T Hz -1/2 at 77 K) and spatial resolution (approx. 0.85 μm). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of λ for different vortices within the scanning field. (author)

  9. Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

    Science.gov (United States)

    Gaskin, Jessica; Abbott, Terry; Medley, Stephanie; Gregory, Don; Thaisen, Kevin; Taylor , Lawrence; Ramsey, Brian; Jerman, Gregory; Sampson, Allen; Harvey, Ralph

    2010-01-01

    The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

  10. Examination of mycological samples by means of the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M. Thibaut

    1973-04-01

    Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.Três espécies de Sifomicetas: Rhizopus arhizus, Rhizopus equinus, Rhizopus nigricans e um Septomiceta: Emericella nidulans foram examinados em microscopia de exploração. Esta técnica mostrou detalhes não evidenciáveis ao poder de resolução do microscópio óptico, demonstrando ser útil para o diagnóstico em micologia.

  11. Evaluation of Enterococcus faecalis adhesion, penetration, and method to prevent the penetration of Enterococcus faecalis into root cementum: Confocal laser scanning microscope and scanning electron microscope analysis.

    Science.gov (United States)

    Halkai, Rahul S; Hegde, Mithra N; Halkai, Kiran R

    2016-01-01

    To ascertain the role of Enterococcus faecalis in persistent infection and a possible method to prevent the penetration of E. faecalis into root cementum. One hundred and twenty human single-rooted extracted teeth divided into five groups. Group I (control): intact teeth, Group II: no apical treatment done, Group III divided into two subgroups. In Groups IIIa and IIIb, root apex treated with lactic acid of acidic and neutral pH, respectively. Group IV: apical root cementum exposed to lactic acid and roughened to mimic the apical resorption. Group V: apical treatment done same as Group IV and root-end filling done using mineral trioxide aggregate (MTA). Apical one-third of all samples immersed in E. faecalis broth for 8 weeks followed by bone morphogenetic protein and obturation and again immersed into broth for 8 weeks. Teeth split into two halves and observed under confocal laser scanning microscope and scanning electron microscope, organism identified by culture and polymerase chain reaction techniques. Adhesion and penetration was observed in Group IIIa and Group IV. Only adhesion in Group II and IIIB and no adhesion and penetration in Group I and V. Adhesion and penetration of E. faecalis into root cementum providing a long-term nidus for subsequent infection are the possible reason for persistent infection and root-end filling with MTA prevents the adhesion and penetration.

  12. Haptic-STM: a human-in-the-loop interface to a scanning tunneling microscope.

    Science.gov (United States)

    Perdigão, Luís M A; Saywell, Alex

    2011-07-01

    The operation of a haptic device interfaced with a scanning tunneling microscope (STM) is presented here. The user moves the STM tip in three dimensions by means of a stylus attached to the haptic instrument. The tunneling current measured by the STM is converted to a vertical force, applied to the stylus and felt by the user, with the user being incorporated into the feedback loop that controls the tip-surface distance. A haptic-STM interface of this nature allows the user to feel atomic features on the surface and facilitates the tactile manipulation of the adsorbate/substrate system. The operation of this device is demonstrated via the room temperature STM imaging of C(60) molecules adsorbed on an Au(111) surface in ultra-high vacuum.

  13. Fine Metal Mask 3-Dimensional Measurement by using Scanning Digital Holographic Microscope

    Science.gov (United States)

    Shin, Sanghoon; Yu, Younghun

    2018-04-01

    For three-dimensional microscopy, fast and high axial resolution are very important. Extending the depth of field for digital holographic is necessary for three-dimensional measurements of thick samples. We propose an optical sectioning method for optical scanning digital holography that is performed in the frequency domain by spatial filtering of a reconstructed amplitude image. We established a scanning dual-wavelength off-axis digital holographic microscope to measure samples that exhibit a large amount of coherent noise and a thickness larger than the depth of focus of the objective lens. As a demonstration, we performed a three-dimensional measurement of a fine metal mask with a reconstructed sectional phase image and filtering with a reconstructed amplitude image.

  14. Optical microscope illumination analysis using through-focus scanning optical microscopy.

    Science.gov (United States)

    Attota, Ravi Kiran; Park, Haesung

    2017-06-15

    Misalignment of the aperture diaphragm present in optical microscopes results in angular illumination asymmetry (ANILAS) at the sample plane. Here we show that through-focus propagation of ANILAS results in a lateral image shift with a focus position. This could lead to substantial errors in quantitative results for optical methods that use through-focus images such as three-dimensional nanoparticle tracking, confocal microscopy, and through-focus scanning optical microscopy (TSOM). A correlation exists between ANILAS and the slant in TSOM images. Hence, the slant in the TSOM image can be used to detect, analyze, and rectify the presence of ANILAS.

  15. Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film.

    Science.gov (United States)

    Shiloh, Roy; Remez, Roei; Lu, Peng-Han; Jin, Lei; Lereah, Yossi; Tavabi, Amir H; Dunin-Borkowski, Rafal E; Arie, Ady

    2018-06-01

    Nearly eighty years ago, Scherzer showed that rotationally symmetric, charge-free, static electron lenses are limited by an unavoidable, positive spherical aberration. Following a long struggle, a major breakthrough in the spatial resolution of electron microscopes was reached two decades ago by abandoning the first of these conditions, with the successful development of multipole aberration correctors. Here, we use a refractive silicon nitride thin film to tackle the second of Scherzer's constraints and demonstrate an alternative method for correcting spherical aberration in a scanning transmission electron microscope. We reveal features in Si and Cu samples that cannot be resolved in an uncorrected microscope. Our thin film corrector can be implemented as an immediate low cost upgrade to existing electron microscopes without re-engineering of the electron column or complicated operation protocols and can be extended to the correction of additional aberrations. Copyright © 2018 The Authors. Published by Elsevier B.V. All rights reserved.

  16. Path-separated electron interferometry in a scanning transmission electron microscope

    Science.gov (United States)

    Yasin, Fehmi S.; Harvey, Tyler R.; Chess, Jordan J.; Pierce, Jordan S.; McMorran, Benjamin J.

    2018-05-01

    We report a path-separated electron interferometer within a scanning transmission electron microscope. In this setup, we use a nanofabricated grating as an amplitude-division beamsplitter to prepare multiple spatially separated, coherent electron probe beams. We achieve path separations of 30 nm. We pass the  +1 diffraction order probe through amorphous carbon while passing the 0th and  ‑1 orders through vacuum. The probes are then made to interfere via imaging optics, and we observe an interference pattern at the CCD detector with up to 39.7% fringe visibility. We show preliminary experimental results in which the interference pattern was recorded during a 1D scan of the diffracted probes across a test phase object. These results qualitatively agree with a modeled interference predicted by an independent measurement of the specimen thickness. This experimental design can potentially be applied to phase contrast imaging and fundamental physics experiments, such as an exploration of electron wave packet coherence length.

  17. Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

    Energy Technology Data Exchange (ETDEWEB)

    Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao [Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki, 305-8573 (Japan)

    2016-01-28

    Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data.

  18. Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

    International Nuclear Information System (INIS)

    Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

    2016-01-01

    Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data

  19. Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

    Science.gov (United States)

    Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

    2016-01-01

    Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke's tabulated data.

  20. Top-down topography of deeply etched silicon in the scanning electron microscope

    International Nuclear Information System (INIS)

    Wells, Oliver C.; Murray, Conal E.; Rullan, Jonathan L.; Gignac, Lynne M.

    2004-01-01

    It is proposed to measure the cross sections of steep-sided etched lines and similar deep surface topography on partially completed silicon integrated circuit wafers using either the backscattered electron (BSE) or the low-loss electron (LLE) image in the scanning electron microscope (SEM). These images contain regions where the collected signal is zero because there is no direct line of sight between the landing point of the electron beam on the specimen and the BSE or LLE detector. It is proposed to use the boundary of such a region in the SEM image as a geometrical line to measure the surface topography. Or alternatively, a shadow can be seen in the distribution of either BSE or LLE with an image-forming detector system. The use of this shadow position on the detector to measure deep surface topography will be demonstrated

  1. In-situ Crystallization of Highly Volatile Commercial Mold Flux Using an Isolated Observation System in the Confocal Laser Scanning Microscope

    Science.gov (United States)

    Park, Jun-Yong; Ryu, Jae Wook; Sohn, Il

    2014-08-01

    The in situ crystallization behavior of highly volatile commercial mold fluxes for medium carbon steels was investigated using the confocal laser scanning microscope (CLSM) equipped with an optimized isolated observation system. The highly volatile compounds of the mold flux were suppressed during heating allowing direct observation in the CLSM. Cooling rates of 25, 50, 100, 400, and 800 K/min were incorporated and continuous cooling transformation (CCT) diagrams of 4 different commercial mold fluxes for medium carbon steels were developed. Identification of the crystalline phase was conducted with XRD and SEM-EDS analysis. A cuspidine crystalline was observed in all samples at various cooling rates. With higher basicity, CaF2, and NaF, the crystallization of the fluxes was enhanced according to the CCT diagram. As the slag structure becomes depolymerized, the diffusion rate of the cathodic ions seems to increase.

  2. A variable-temperature scanning tunneling microscope capable of single-molecule vibrational spectroscopy

    International Nuclear Information System (INIS)

    Stipe, B.C.; Rezaei, M.A.; Ho, W.

    1999-01-01

    The design and performance of a variable-temperature scanning tunneling microscope (STM) is presented. The microscope operates from 8 to 350 K in ultrahigh vacuum. The thermally compensated STM is suspended by springs from the cold tip of a continuous flow cryostat and is completely surrounded by two radiation shields. The design allows for in situ dosing and irradiation of the sample as well as for the exchange of samples and STM tips. With the STM feedback loop off, the drift of the tip-sample spacing is approximately 0.001 Angstrom/min at 8 K. It is demonstrated that the STM is well-suited for the study of atomic-scale chemistry over a wide temperature range, for atomic-scale manipulation, and for single-molecule inelastic electron tunneling spectroscopy (IETS). copyright 1999 American Institute of Physics

  3. Development and evaluation of an automated reflectance microscope system for the petrographic characterization of bituminous coals

    Energy Technology Data Exchange (ETDEWEB)

    Hoover, D. S.; Davis, A.

    1980-10-01

    The development of automated coal petrographic techniques will lessen the demands on skilled personnel to do routine work. This project is concerned with the development and successful testing of an instrument which will meet these needs. The fundamental differences in reflectance of the three primary maceral groups should enable their differentiation in an automated-reflectance frequency histogram (reflectogram). Consequently, reflected light photometry was chosen as the method for automating coal petrographic analysis. Three generations of an automated system (called Rapid Scan Versions I, II and III) were developed and evaluated for petrographic analysis. Their basic design was that of a reflected-light microscope photometer with an automatic stage, interfaced with a minicomputer. The hardware elements used in the Rapid Scan Version I limited the system's flexibility and presented problems with signal digitization and measurement precision. Rapid Scan Version II was designed to incorporate a new microscope photometer and computer system. A digital stepping stage was incorporated into the Rapid Scan Version III system. The precision of reflectance determination of this system was found to be +- 0.02 percent reflectance. The limiting factor in quantitative interpretation of Rapid Scan reflectograms is the resolution of reflectance populations of the individual maceral groups. Statistical testing indicated that reflectograms were highly reproducible, and a new computer program, PETAN, was written to interpret the curves for vitrinite reflectance parameters ad petrographic.

  4. A design for a subminiature, low energy scanning electron microscope with atomic resolution

    International Nuclear Information System (INIS)

    Eastham, D. A.; Edmondson, P.; Greene, S.; Donnelly, S.; Olsson, E.; Svensson, K.; Bleloch, A.

    2009-01-01

    We describe a type of scanning electron microscope that works by directly imaging the electron field-emission sites on a nanotip. Electrons are extracted from the nanotip through a nanoscale aperture, accelerated in a high electric field, and focused to a spot using a microscale Einzel lens. If the whole microscope (accelerating section and lens) and the focal length are both restricted in size to below 10 μm, then computer simulations show that the effects of aberration are extremely small and it is possible to have a system with approximately unit magnification at electron energies as low as 300 eV. Thus a typical emission site of 1 nm diameter will produce an image of the same size, and an atomic emission site will give a resolution of 0.1-0.2 nm (1-2 A). Also, because the beam is not allowed to expand beyond 100 nm in diameter, the depth of field is large and the contribution to the beam spot size from chromatic aberrations is less than 0.02 nm (0.2 A) for 500 eV electrons. Since it is now entirely possible to make stable atomic sized emitters (nanopyramids), it is expected that this instrument will have atomic resolution. Furthermore the brightness of the beam is determined only by the field emission and can be up to 1x10 6 times larger than in a typical (high energy) electron microscope. The advantages of this low energy, bright-beam electron microscope with atomic resolution are described and include the possibility of it being used to rapidly sequence the human genome from a single strand of DNA as well as being able to identify atomic species directly from the elastic scattering of electrons

  5. Scanning vector Hall probe microscopy

    International Nuclear Information System (INIS)

    Cambel, V.; Gregusova, D.; Fedor, J.; Kudela, R.; Bending, S.J.

    2004-01-01

    We have developed a scanning vector Hall probe microscope for mapping magnetic field vector over magnetic samples. The microscope is based on a micromachined Hall sensor and the cryostat with scanning system. The vector Hall sensor active area is ∼5x5 μm 2 . It is realized by patterning three Hall probes on the tilted faces of GaAs pyramids. Data from these 'tilted' Hall probes are used to reconstruct the full magnetic field vector. The scanning area of the microscope is 5x5 mm 2 , space resolution 2.5 μm, field resolution ∼1 μT Hz -1/2 at temperatures 10-300 K

  6. Accurate virus quantitation using a Scanning Transmission Electron Microscopy (STEM) detector in a scanning electron microscope.

    Science.gov (United States)

    Blancett, Candace D; Fetterer, David P; Koistinen, Keith A; Morazzani, Elaine M; Monninger, Mitchell K; Piper, Ashley E; Kuehl, Kathleen A; Kearney, Brian J; Norris, Sarah L; Rossi, Cynthia A; Glass, Pamela J; Sun, Mei G

    2017-10-01

    A method for accurate quantitation of virus particles has long been sought, but a perfect method still eludes the scientific community. Electron Microscopy (EM) quantitation is a valuable technique because it provides direct morphology information and counts of all viral particles, whether or not they are infectious. In the past, EM negative stain quantitation methods have been cited as inaccurate, non-reproducible, and with detection limits that were too high to be useful. To improve accuracy and reproducibility, we have developed a method termed Scanning Transmission Electron Microscopy - Virus Quantitation (STEM-VQ), which simplifies sample preparation and uses a high throughput STEM detector in a Scanning Electron Microscope (SEM) coupled with commercially available software. In this paper, we demonstrate STEM-VQ with an alphavirus stock preparation to present the method's accuracy and reproducibility, including a comparison of STEM-VQ to viral plaque assay and the ViroCyt Virus Counter. Copyright © 2017 The Authors. Published by Elsevier B.V. All rights reserved.

  7. Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.

    Science.gov (United States)

    Yoon, Yeo Hun; Kim, Seung Jae; Kim, Dong Hwan

    2015-12-01

    The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film. © The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  8. Scanning tunneling microscope with a rotary piezoelectric stepping motor

    Science.gov (United States)

    Yakimov, V. N.

    1996-02-01

    A compact scanning tunneling microscope (STM) with a novel rotary piezoelectric stepping motor for coarse positioning has been developed. An inertial method for rotating of the rotor by the pair of piezoplates has been used in the piezomotor. Minimal angular step size was about several arcsec with the spindle working torque up to 1 N×cm. Design of the STM was noticeably simplified by utilization of the piezomotor with such small step size. A shaft eccentrically attached to the piezomotor spindle made it possible to push and pull back the cylindrical bush with the tubular piezoscanner. A linear step of coarse positioning was about 50 nm. STM resolution in vertical direction was better than 0.1 nm without an external vibration isolation.

  9. A new Scanning Transmission X-ray Microscope at the ALS for operation up to 2500eV

    International Nuclear Information System (INIS)

    Kilcoyne, David; Ade, Harald; Attwood, David; Hitchcock, Adam; McKean, Pat; Mitchell, Gary; Monteiro, Paulo; Tyliszczak, Tolek; Warwick, Tony

    2010-01-01

    We report on the design and construction of a higher energy Scanning Transmission X-ray Microscope on a new bend magnet beam line at the Advanced Light Source. Previously we have operated such an instrument on a bend magnet for C, N and O 1s NEXAFS spectroscopy. The new instrument will have similar performance at higher energies up to and including the S 1s edge at 2472eV. A new microscope configuration is planned. A more open geometry will allow a fluorescence detector to count emitted photons from the front surface of the sample. There will be a capability for zone plate scanning in addition to the more conventional sample scanning mode. This will add the capability for imaging a massive sample at high resolution over a limited field of view, so that heavy reaction cells may be used to study processes in-situ, exploiting the longer photon attenuation length and the longer zone plate working distances available at higher photon energy. The energy range will extend down to include the C1s edge at 300eV, to allow high energy NEXAFS microscopic studies to correlate with the imaging of organics in the same sample region of interest.

  10. Contact detection for nanomanipulation in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ru, Changhai, E-mail: rchhai@gmail.com [Automation College, Harbin Engineering University, Harbin 150001 (China); Robotics and Microsystems Center, Soochow University, Jiangsu 215021 (China); To, Steve, E-mail: Steve.to@utoronto.ca [Department of Mechanical and Industry Engineering, University of Toronto, Ontario, Canada M5S3G8 (Canada)

    2012-07-15

    Nanomanipulation systems require accurate knowledge of the end-effector position in all three spatial coordinates, XYZ, for reliable manipulation of nanostructures. Although the images acquired by a scanning electron microscope (SEM) provide high resolution XY information, the lack of depth information in the Z-direction makes 3D nanomanipulation time-consuming. Existing approaches for contact detection of end-effectors inside SEM typically utilize fragile touch sensors that are difficult to integrate into a nanomanipulation system. This paper presents a method for determining the contact between an end-effector and a target surface during nanomanipulation inside SEM, purely based on the processing of SEM images. A depth-from-focus method is used in the fast approach of the end-effector to the substrate, followed by fine contact detection. Experimental results demonstrate that the contact detection approach is capable of achieving an accuracy of 21.5 nm at 50,000 Multiplication-Sign magnification while inducing little end-effector damage. -- Highlights: Black-Right-Pointing-Pointer We presents a simple method for obtaining the depth information in SEM-based nanomanipulation. Black-Right-Pointing-Pointer Detecting contact between an end-effector and a target surface using SEM as a vision sensor. Black-Right-Pointing-Pointer Additional touch/force sensors or specialized hardware need not be added. Black-Right-Pointing-Pointer Achieved high repeatability and accuracy. Black-Right-Pointing-Pointer Complete automatic contact detection within typically 60 s.

  11. Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics

    International Nuclear Information System (INIS)

    Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

    2013-01-01

    A novel three-dimensional X-ray microtomographic micro-imaging system which enables simultaneous measurement of differential phase contrast and absorption contrast has been developed. The optical system consists of a scanning microscope with one-dimensional focusing device and an imaging microscope with one-dimensional objective. A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning–imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dimensional (2D) image is recorded independently. An object is illuminated with a line-focused beam. Positional information of the region illuminated by the line-focused beam is recorded with the 1D imaging microscope optics as line-profile data. By scanning the object with the line focus, 2D image data are obtained. In the same manner as for a scanning microscope optics with a multi-pixel detector, imaging modes such as phase contrast and absorption contrast can be arbitrarily configured after the image data acquisition. By combining a tomographic scan method and the SIXM system, quantitative 3D imaging is performed. Results of a feasibility study of the SIXM for 3D imaging are shown

  12. Nanoscale Energy-Filtered Scanning Confocal Electron Microscopy Using a Double-Aberration-Corrected Transmission Electron Microscope

    International Nuclear Information System (INIS)

    Wang Peng; Behan, Gavin; Kirkland, Angus I.; Nellist, Peter D.; Takeguchi, Masaki; Hashimoto, Ayako; Mitsuishi, Kazutaka; Shimojo, Masayuki

    2010-01-01

    We demonstrate that a transmission electron microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal electron microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

  13. A novel phase-sensitive scanning near-field optical microscope

    International Nuclear Information System (INIS)

    Wu Xiao-Yu; Lin Sun; Tan Qiao-Feng; Wang Jia

    2015-01-01

    Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and further affects the intensity distribution. In recent years, the designs of surface plasmon polariton (SPP) devices have mostly been based on the phase modulation and manipulation. Here we demonstrate a phase sensitive multi-parameter heterodyne scanning near-field optical microscope (SNOM) with an aperture probe in the visible range, with which the near field optical phase and amplitude distributions can be simultaneously obtained. A novel architecture combining a spatial optical path and a fiber optical path is employed for stability and flexibility. Two kinds of typical nano-photonic devices are tested with the system. With the phase-sensitive SNOM, the phase and amplitude distributions of any nano-optical field and localized field generated with any SPP nano-structures and irregular phase modulation surfaces can be investigated. The phase distribution and the interference pattern will help us to gain a better understanding of how light interacts with SPP structures and how SPP waves generate, localize, convert, and propagate on an SPP surface. This will be a significant guidance on SPP nano-structure design and optimization. (paper)

  14. Combined Scanning Nanoindentation and Tunneling Microscope Technique by Means of Semiconductive Diamond Berkovich Tip

    International Nuclear Information System (INIS)

    Lysenko, O; Novikov, N; Gontar, A; Grushko, V; Shcherbakov, A

    2007-01-01

    A combined Scanning Probe Microscope (SPM) - nanoindentation instrument enables submicron resolution indentation tests and in-situ scanning of structure surfaces. A newly developed technique is based on the scanning tunneling microscopy (STM) with integrated Berkovich diamond semiconductive tip. Diamond tips for a combined SPM were obtained using the developed procedure including the synthesis of the semiconductive borondoped diamond monocrystals by the temperature gradient method at high pressure - high temperature conditions and fabrication of the tips from these crystals considering their zonal structure. Separately grown semiconductive diamond single crystals were studied in order to find the best orientation of diamond crystals. Optimal scanning characteristics and experimental data errors were calculated by an analysis of the general functional dependence of the tunneling current from properties of the tip and specimen. Tests on the indentation and scanning of the gold film deposited on the silicon substrate employing the fabricated tips demonstrated their usability, acceptable resolution and sensitivity

  15. Differential phase microscope and micro-tomography with a Foucault knife-edge scanning filter

    Science.gov (United States)

    Watanabe, N.; Hashizume, J.; Goto, M.; Yamaguchi, M.; Tsujimura, T.; Aoki, S.

    2013-10-01

    An x-ray differential phase microscope with a Foucault knife-edge scanning filter was set up at the bending magnet source BL3C, Photon Factory. A reconstructed phase profile from the differential phase image of an aluminium wire at 5.36 keV was fairly good agreement with the numerical simulation. Phase tomography of a biological specimen, such as an Artemia cyst, could be successfully demonstrated.

  16. Ultrastructural alterations in ciliary cells exposed to ionizing radiation. A scanning and transmission electron microscopic study

    Energy Technology Data Exchange (ETDEWEB)

    Baldetorp, L; Mecklenburg, C v; Haakansson, C H [Lund Univ. (Sweden). Hospital; Lund Univ. (Sweden). Dept. of Zoology)

    1977-01-01

    Early effects of ionizing radiation were investigated in an experimental in vitro system using the ciliary cells of the tracheal mucous membrane of the rabbit, irradiated at 30/sup 0/C and at more than 90% humidity. The changes in physiological activities of the ciliary cells caused by irradation were continously registered during the irradation. The specimens were examined immediately after irradiation electron microscopically. The morphological changes in irradiated material after 10-70 Gy are compared with normal material. After 40-70 Gy, scanning electron microscopy revealed the formation of vesicles on cilia, and club-like protrusions and adhesion of their tips. After 30-70 Gy, a swelling of mitochondrial membranes and cristae was apparent transmission electron microscopically. The membrane alterations caused by irradiation are assumed to disturb the permeability and flow of ATP from the mitochondria, which in turn leads to the recorded changes in the activity of the ciliated cells.

  17. High Pressure Scanning Tunneling Microscopy Studies of Adsorbate Structure and Mobility during Catalytic Reactions. Novel Design of an Ultra High Pressure, High Temperature Scanning Tunneling Microscope System for Probing Catalytic Conversions

    International Nuclear Information System (INIS)

    Tang, David Chi-Wai

    2005-01-01

    The aim of the work presented therein is to take advantage of scanning tunneling microscope's (STM) capability for operation under a variety of environments under real time and at atomic resolution to monitor adsorbate structures and mobility under high pressures, as well as to design a new generation of STM systems that allow imaging in situ at both higher pressures (35 atm) and temperatures (350 C). The design of a high pressure, high temperature scanning tunneling microscope system, that is capable of monitoring reactions in situ at conditions from UHV and ambient temperature up to 1 atm and 250 C, is briefly presented along with vibrational and thermal analysis, as this system serves as a template to improve upon during the design of the new ultra high pressure, high temperature STM. Using this existing high pressure scanning tunneling microscope we monitored the co-adsorption of hydrogen, ethylene and carbon dioxide on platinum (111) and rhodium (111) crystal faces in the mTorr pressure range at 300 K in equilibrium with the gas phase. During the catalytic hydrogenation of ethylene to ethane in the absence of CO the metal surfaces are covered by an adsorbate layer that is very mobile on the time scale of STM imaging. We found that the addition of CO poisons the hydrogenation reaction and induces ordered structures on the single crystal surfaces. Several ordered structures were observed upon CO addition to the surfaces pre-covered with hydrogen and ethylene: a rotated (√19 x √19)R23.4 o on Pt(111), and domains of c(4 x 2)-CO+C 2 H 3 , previously unobserved (4 x 2)-CO+3C 2 H 3 , and (2 x 2)-3CO on Rh(111). A mechanism for CO poisoning of ethylene hydrogenation on the metal single crystals was proposed, in which CO blocks surface metal sites and reduces adsorbate mobility to limit adsorption and reaction rate of ethylene and hydrogen. In order to observe heterogeneous catalytic reactions that occur well above ambient pressure and temperature that more closely

  18. Wavelength dependence of the magnetic resolution of the magneto-optical near-field scanning tunneling microscope

    NARCIS (Netherlands)

    Schad, R.; Jordan, S.M.; Stoelinga, M.J.P.; Prins, M.W.J.; Groeneveld, R.H.M.; Kempen, van H.; Kesteren, van H.W.

    1998-01-01

    A magneto-optical near-field scanning tunneling microscope is used to image the prewritten magnetic domain structure of a Pt/Co multilayer. A semiconducting tip acts as a local photodetector to measure the magnetic circular dichroism signal coming from the magnetic sample. The resolution of the

  19. Realization of a four-step molecular switch in scanning tunneling microscope manipulation of single chlorophyll-a molecules

    Science.gov (United States)

    Iancu, Violeta; Hla, Saw-Wai

    2006-01-01

    Single chlorophyll-a molecules, a vital resource for the sustenance of life on Earth, have been investigated by using scanning tunneling microscope manipulation and spectroscopy on a gold substrate at 4.6 K. Chlorophyll-a binds on Au(111) via its porphyrin unit while the phytyl-chain is elevated from the surface by the support of four CH3 groups. By injecting tunneling electrons from the scanning tunneling microscope tip, we are able to bend the phytyl-chain, which enables the switching of four molecular conformations in a controlled manner. Statistical analyses and structural calculations reveal that all reversible switching mechanisms are initiated by a single tunneling-electron energy-transfer process, which induces bond rotation within the phytyl-chain. PMID:16954201

  20. Thin-film thickness measurement using x-ray peak ratioing in the scanning electron microscope

    International Nuclear Information System (INIS)

    Elliott, N.E.; Anderson, W.E.; Archuleta, T.A.; Stupin, D.M.

    1981-01-01

    The procedure used to measure laser target film thickness using a scanning electron microscope is summarized. This method is generally applicable to any coating on any substrate as long as the electron energy is sufficient to penetrate the coating and the substrate produces an x-ray signal which can pass back through the coating and be detected

  1. In situ laser processing in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Roberts, Nicholas A.; Magel, Gregory A.; Hartfield, Cheryl D.; Moore, Thomas M.; Fowlkes, Jason D.; Rack, Philip D. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Omniprobe, Inc., an Oxford Instruments Company, 10410 Miller Rd., Dallas, Texas 75238 (United States); Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States) and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

    2012-07-15

    Laser delivery probes using multimode fiber optic delivery and bulk focusing optics have been constructed and used for performing materials processing experiments within scanning electron microscope/focused ion beam instruments. Controlling the current driving a 915-nm semiconductor diode laser module enables continuous or pulsed operation down to sub-microsecond durations, and with spot sizes on the order of 50 {mu}m diameter, achieving irradiances at a sample surface exceeding 1 MW/cm{sup 2}. Localized laser heating has been used to demonstrate laser chemical vapor deposition of Pt, surface melting of silicon, enhanced purity, and resistivity via laser annealing of Au deposits formed by electron beam induced deposition, and in situ secondary electron imaging of laser induced dewetting of Au metal films on SiO{sub x}.

  2. The scanning tunneling microscope

    International Nuclear Information System (INIS)

    Salvan, F.

    1986-01-01

    A newly conceived microscope, based on a pure quantum phenomenon, is an ideal tool to study atom by atom the topography and properties of surfaces. Applications are presented: surface ''reconstruction'' of silicon, lamellar compound study, etc... Spectroscopy by tunnel effect will bring important information on electronic properties; it is presented with an application on silicon [fr

  3. ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction

    International Nuclear Information System (INIS)

    Wu Yan; Shannon, Mark A.

    2006-01-01

    The dependence of the contact potential difference (CPD) reading on the ac driving amplitude in scanning Kelvin probe microscope (SKPM) hinders researchers from quantifying true material properties. We show theoretically and demonstrate experimentally that an ac driving amplitude dependence in the SKPM measurement can come from a systematic error, and it is common for all tip sample systems as long as there is a nonzero tracking error in the feedback control loop of the instrument. We further propose a methodology to detect and to correct the ac driving amplitude dependent systematic error in SKPM measurements. The true contact potential difference can be found by applying a linear regression to the measured CPD versus one over ac driving amplitude data. Two scenarios are studied: (a) when the surface being scanned by SKPM is not semiconducting and there is an ac driving amplitude dependent systematic error; (b) when a semiconductor surface is probed and asymmetric band bending occurs when the systematic error is present. Experiments are conducted using a commercial SKPM and CPD measurement results of two systems: platinum-iridium/gap/gold and platinum-iridium/gap/thermal oxide/silicon are discussed

  4. A line scanned light-sheet microscope with phase shaped self-reconstructing beams.

    Science.gov (United States)

    Fahrbach, Florian O; Rohrbach, Alexander

    2010-11-08

    We recently demonstrated that Microscopy with Self-Reconstructing Beams (MISERB) increases both image quality and penetration depth of illumination beams in strongly scattering media. Based on the concept of line scanned light-sheet microscopy, we present an add-on module to a standard inverted microscope using a scanned beam that is shaped in phase and amplitude by a spatial light modulator. We explain technical details of the setup as well as of the holograms for the creation, positioning and scaling of static light-sheets, Gaussian beams and Bessel beams. The comparison of images from identical sample areas illuminated by different beams allows a precise assessment of the interconnection between beam shape and image quality. The superior propagation ability of Bessel beams through inhomogeneous media is demonstrated by measurements on various scattering media.

  5. A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope.

    Science.gov (United States)

    Trägårdh, J; Macrae, K; Travis, C; Amor, R; Norris, G; Wilson, S H; Oppo, G-L; McConnell, G

    2015-07-01

    We report a method for characterizing the focussing laser beam exiting the objective in a laser scanning microscope. This method provides the size of the optical focus, the divergence of the beam, the ellipticity and the astigmatism. We use a microscopic-scale knife edge in the form of a simple transmission electron microscopy grid attached to a glass microscope slide, and a light-collecting optical fibre and photodiode underneath the specimen. By scanning the laser spot from a reflective to a transmitting part of the grid, a beam profile in the form of an error function can be obtained and by repeating this with the knife edge at different axial positions relative to the beam waist, the divergence and astigmatism of the postobjective laser beam can be obtained. The measured divergence can be used to quantify how much of the full numerical aperture of the lens is used in practice. We present data of the beam radius, beam divergence, ellipticity and astigmatism obtained with low (0.15, 0.7) and high (1.3) numerical aperture lenses and lasers commonly used in confocal and multiphoton laser scanning microscopy. Our knife-edge method has several advantages over alternative knife-edge methods used in microscopy including that the knife edge is easy to prepare, that the beam can be characterized also directly under a cover slip, as necessary to reduce spherical aberrations for objectives designed to be used with a cover slip, and it is suitable for use with commercial laser scanning microscopes where access to the laser beam can be limited. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

  6. On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope.

    Science.gov (United States)

    Sun, Cheng; Müller, Erich; Meffert, Matthias; Gerthsen, Dagmar

    2018-04-01

    Transmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.

  7. Design of a scanning probe microscope with advanced sample treatment capabilities: An atomic force microscope combined with a miniaturized inductively coupled plasma source

    International Nuclear Information System (INIS)

    Hund, Markus; Herold, Hans

    2007-01-01

    We describe the design and performance of an atomic force microscope (AFM) combined with a miniaturized inductively coupled plasma source working at a radio frequency of 27.12 MHz. State-of-the-art scanning probe microscopes (SPMs) have limited in situ sample treatment capabilities. Aggressive treatments such as plasma etching or harsh treatments such as etching in aggressive liquids typically require the removal of the sample from the microscope. Consequently, time consuming procedures are required if the same sample spot has to be imaged after successive processing steps. We have developed a first prototype of a SPM which features a quasi in situ sample treatment using a modified commercial atomic force microscope. A sample holder is positioned in a special reactor chamber; the AFM tip can be retracted by several millimeters so that the chamber can be closed for a treatment procedure. Most importantly, after the treatment, the tip is moved back to the sample with a lateral drift per process step in the 20 nm regime. The performance of the prototype is characterized by consecutive plasma etching of a nanostructured polymer film

  8. Design and performance of an ultra-high vacuum scanning tunneling microscope operating at dilution refrigerator temperatures and high magnetic fields.

    Science.gov (United States)

    Misra, S; Zhou, B B; Drozdov, I K; Seo, J; Urban, L; Gyenis, A; Kingsley, S C J; Jones, H; Yazdani, A

    2013-10-01

    We describe the construction and performance of a scanning tunneling microscope capable of taking maps of the tunneling density of states with sub-atomic spatial resolution at dilution refrigerator temperatures and high (14 T) magnetic fields. The fully ultra-high vacuum system features visual access to a two-sample microscope stage at the end of a bottom-loading dilution refrigerator, which facilitates the transfer of in situ prepared tips and samples. The two-sample stage enables location of the best area of the sample under study and extends the experiment lifetime. The successful thermal anchoring of the microscope, described in detail, is confirmed through a base temperature reading of 20 mK, along with a measured electron temperature of 250 mK. Atomically resolved images, along with complementary vibration measurements, are presented to confirm the effectiveness of the vibration isolation scheme in this instrument. Finally, we demonstrate that the microscope is capable of the same level of performance as typical machines with more modest refrigeration by measuring spectroscopic maps at base temperature both at zero field and in an applied magnetic field.

  9. Probing the local microwave properties of superconducting thin films by a scanning microwave near-field microscope

    CERN Document Server

    Wu, L Y; Wang, K L; Jiang, T; Kang, L; Yang, S Z; Wu, P H

    2002-01-01

    In this paper, we present our approach to probe the local microwave properties of superconducting thin films by using the microwave near-field scanning technique. We have employed a coaxial cavity together with a niobium tip as the probe and established a scanning sample stage cooled by liquid nitrogen to study thin film devices at low temperature in our scanning microwave near-field microscope. Nondestructive images have been obtained on the inhomogeneity of the YBaCuO superconducting thin films at microwave frequency. We believe that these results would be helpful in evaluating the microwave performance of the devices.

  10. Manipulation of nanoparticles of different shapes inside a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Boris Polyakov

    2014-02-01

    Full Text Available In this work polyhedron-like gold and sphere-like silver nanoparticles (NPs were manipulated on an oxidized Si substrate to study the dependence of the static friction and the contact area on the particle geometry. Measurements were performed inside a scanning electron microscope (SEM that was equipped with a high-precision XYZ-nanomanipulator. To register the occurring forces a quartz tuning fork (QTF with a glued sharp probe was used. Contact areas and static friction forces were calculated by using different models and compared with the experimentally measured force. The effect of NP morphology on the nanoscale friction is discussed.

  11. In situ measurement of the kinetic friction of ZnO nanowires inside a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Polyakov, Boris, E-mail: boriss.polakovs@ut.ee [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Institute of Solid State Physics, University of Latvia, Kengaraga st. 8, Riga (Latvia); Dorogin, Leonid M; Lohmus, Ants [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Romanov, Alexey E [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia); Ioffe Physical Technical Institute, RAS, Politehnicheskaja st. 26, St. Petersburg (Russian Federation); Lohmus, Rynno [Institute of Physics, University of Tartu, Riia st. 142, Tartu (Estonia)

    2012-01-15

    A novel method for measuring the kinetic friction force in situ was developed for zinc oxide nanowires on highly oriented pyrolytic graphite and oxidised silicon wafers. The experiments were performed inside a scanning electron microscope and used a nanomanipulation device as an actuator, which also had an atomic force microscope tip attached to it as a probe. A simple model based on the Timoshenko elastic beam theory was applied to interpret the elastic deformation of a sliding nanowire (NW) and to determine the distributed kinetic friction force.

  12. Cryogenic scanning laser microscopy. Investigation of large BSCCO mesas and development of a polarizing microscope

    International Nuclear Information System (INIS)

    Guenon, Stefan Alexander

    2011-01-01

    confirmed that the frequency of the emitted radiation and the bias voltage is determined by the Josephson relation for a wide range of different base temperatures. This way other mechanisms, causing THz radiation, rather than the Josephson effect can be excluded. Concerning the second part: Originally it was planned to extend the low-temperature scanning laser microscope with the facility of polarizing microscopy. The idea was to combine the LTSLM voltage imaging with the possibility of magneto-optical imaging. But it soon turned out that a new design would be necessary. A laser scanning polarizing microscope has certain advantages in comparison with a conventional polarizing microscope: Very high illumination intensities can be reached easily, the resolution can be improved by the factor 1.4 if a confocal optical design is used, and the serial signal processing facilitates the optimization of the signal-to-noise ratio. In addition, it is usually not necessary to remove the contrast of non-magnetic origin by subtracting an image of the uniform magnetized sample from the image of interest. In this thesis a design for a cryogenic scanning polarizing microscope (CSPM) is discussed in detail, tests and first results of the system are presented, and an outlook is given how two proceed with this project.

  13. Ultra low-K shrinkage behavior when under electron beam in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Lorut, F.; Imbert, G. [ST Microelectronics, 850 rue Jean Monnet, 38926 Crolles Cedex (France); Roggero, A. [Centre National d' Etudes Spatiales, 18 Avenue Edouard Belin, 31400 Toulouse (France)

    2013-08-28

    In this paper, we investigate the tendency of porous low-K dielectrics (also named Ultra Low-K, ULK) behavior to shrink when exposed to the electron beam of a scanning electron microscope. Various experimental electron beam conditions have been used for irradiating ULK thin films, and the resulting shrinkage has been measured through use of an atomic force microscope tool. We report the shrinkage to be a fast, cumulative, and dose dependent effect. Correlation of the shrinkage with incident electron beam energy loss has also been evidenced. The chemical modification of the ULK films within the interaction volume has been demonstrated, with a densification of the layer and a loss of carbon and hydrogen elements being observed.

  14. Development of an ultrasound microscope combined with optical microscope for multiparametric characterization of a single cell.

    Science.gov (United States)

    Arakawa, Mototaka; Shikama, Joe; Yoshida, Koki; Nagaoka, Ryo; Kobayashi, Kazuto; Saijo, Yoshifumi

    2015-09-01

    Biomechanics of the cell has been gathering much attention because it affects the pathological status in atherosclerosis and cancer. In the present study, an ultrasound microscope system combined with optical microscope for characterization of a single cell with multiple ultrasound parameters was developed. The central frequency of the transducer was 375 MHz and the scan area was 80 × 80 μm with up to 200 × 200 sampling points. An inverted optical microscope was incorporated in the design of the system, allowing for simultaneous optical observations of cultured cells. Two-dimensional mapping of multiple ultrasound parameters, such as sound speed, attenuation, and acoustic impedance, as well as the thickness, density, and bulk modulus of specimen/cell under investigation, etc., was realized by the system. Sound speed and thickness of a 3T3-L1 fibroblast cell were successfully obtained by the system. The ultrasound microscope system combined with optical microscope further enhances our understanding of cellular biomechanics.

  15. Observation of a Ag protrusion on a Ag2S island using a scanning tunneling microscope

    Directory of Open Access Journals (Sweden)

    Takeo Ohno

    2015-01-01

    Full Text Available A silver sulfide (Ag2S island as an ionic conductor in resistive switching memories was formed and a protrusion of silver from the Ag2S formed by an electrochemical reaction was observed using a scanning tunneling microscope.

  16. Characterizing high-energy-formed particulates with the scanning electron microscope/energy dispersive spectrometer system. Progress report, March--September 1977

    International Nuclear Information System (INIS)

    Casey, A.W.; Biermann, A.H.

    1977-01-01

    A method is being sought that will allow the differentiation between particulates formed in implosions and particulates formed in explosions. The scanning electron microscope (SEM) and energy dispersive x-ray analysis (EDS) were used to measure and compare particle size, shape, surface morphology, and composition. Implosion and explosion detonations yielded spherical, smooth particles within the same size range. Although the particle size, shape, and morphology were the same for comparable samples of different detonation type, there were distinct differences in composition. It is not certain whether differences in composition reflect differences in device components or differences in the nature of the detonation

  17. Resizing metal-coated nanopores using a scanning electron microscope.

    Science.gov (United States)

    Chansin, Guillaume A T; Hong, Jongin; Dusting, Jonathan; deMello, Andrew J; Albrecht, Tim; Edel, Joshua B

    2011-10-04

    Electron beam-induced shrinkage provides a convenient way of resizing solid-state nanopores in Si(3) N(4) membranes. Here, a scanning electron microscope (SEM) has been used to resize a range of different focussed ion beam-milled nanopores in Al-coated Si(3) N(4) membranes. Energy-dispersive X-ray spectra and SEM images acquired during resizing highlight that a time-variant carbon deposition process is the dominant mechanism of pore shrinkage, although granular structures on the membrane surface in the vicinity of the pores suggest that competing processes may occur. Shrinkage is observed on the Al side of the pore as well as on the Si(3) N(4) side, while the shrinkage rate is observed to be dependent on a variety of factors. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  18. A high stability and repeatability electrochemical scanning tunneling microscope.

    Science.gov (United States)

    Xia, Zhigang; Wang, Jihao; Hou, Yubin; Lu, Qingyou

    2014-12-01

    We present a home built electrochemical scanning tunneling microscope (ECSTM) with very high stability and repeatability. Its coarse approach is driven by a closely stacked piezo motor of GeckoDrive type with four rigid clamping points, which enhances the rigidity, compactness, and stability greatly. It can give high clarity atomic resolution images without sound and vibration isolations. Its drifting rates in XY and Z directions in solution are as low as 84 pm/min and 59 pm/min, respectively. In addition, repeatable coarse approaches in solution within 2 mm travel distance show a lateral deviation less than 50 nm. The gas environment can be well controlled to lower the evaporation rate of the cell, thus reducing the contamination and elongating the measurement time. Atomically resolved SO4(2-) image on Au (111) work electrode is demonstrated to show the performance of the ECSTM.

  19. Field Emission Scanning Electron Microscope (FESEM) Facility in BTI

    International Nuclear Information System (INIS)

    Cik Rohaida Che Hak; Foo, C.T.; Nor Azillah Fatimah Othman

    2015-01-01

    Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. The GeminisSEM 500, a new FESEM imaging facility will be installed soon in MTEC, BTI. It provides resolution of the images is as low as 0.6 nm at 15 kV and 1.2 nm at 1 kV, allowing examination of the top surface of nano powders, nano film and nano fiber in the wide range of applications such as mineralogy, ceramics, polymer, metallurgy, electronic devices, chemistry, physics and life sciences. This system is equipped with several detectors to detect various signals such as secondary electrons (SE) detector for topographic information and back-scattered electrons (BSE) detector for materials composition contrast. Energy dispersive x-ray spectroscopy (EDS) with detector energy resolution of < 129 eV and detection limit in the range of 1000-3000 ppm coupled with FE-SEM is used to determine the chemical composition of micro-features including boron (B) to uranium (U). Wavelength dispersive x-ray spectroscopy (WDS) which has detector resolution of 2-20 eV and detection limit of 30-300 ppm coupled with FE-SEM is used to detect elements that cannot be resolved with EDS. The ultra-high resolution imaging combined with the high sensitivity WDS helps to resolve the thorium and rare earth elemental analysis. (author)

  20. Selective scanning tunneling microscope light emission from rutile phase of VO2.

    Science.gov (United States)

    Sakai, Joe; Kuwahara, Masashi; Hotsuki, Masaki; Katano, Satoshi; Uehara, Yoichi

    2016-09-28

    We observed scanning tunneling microscope light emission (STM-LE) induced by a tunneling current at the gap between an Ag tip and a VO2 thin film, in parallel to scanning tunneling spectroscopy (STS) profiles. The 34 nm thick VO2 film grown on a rutile TiO2 (0 0 1) substrate consisted of both rutile (R)- and monoclinic (M)-structure phases of a few 10 nm-sized domains at room temperature. We found that STM-LE with a certain photon energy of 2.0 eV occurs selectively from R-phase domains of VO2, while no STM-LE was observed from M-phase. The mechanism of STM-LE from R-phase VO2 was determined to be an interband transition process rather than inverse photoemission or inelastic tunneling processes.

  1. Note: optical optimization for ultrasensitive photon mapping with submolecular resolution by scanning tunneling microscope induced luminescence.

    Science.gov (United States)

    Chen, L G; Zhang, C; Zhang, R; Zhang, X L; Dong, Z C

    2013-06-01

    We report the development of a custom scanning tunneling microscope equipped with photon collection and detection systems. The optical optimization includes the comprehensive design of aspherical lens for light collimation and condensing, the sophisticated piezo stages for in situ lens adjustment inside ultrahigh vacuum, and the fiber-free coupling of collected photons directly onto the ultrasensitive single-photon detectors. We also demonstrate submolecular photon mapping for the molecular islands of porphyrin on Ag(111) under small tunneling currents down to 10 pA and short exposure time down to 1.2 ms/pixel. A high quantum efficiency up to 10(-2) was also observed.

  2. Core-state manipulation of single Fe impurities in GaAs with a scanning tunneling microscope

    NARCIS (Netherlands)

    Bocquel, J.; Kortan, V.R.; Sahin, C.; Campion, R.P.; Gallagher, B.L.; Flatte, M.E.; Koenraad, P.M.

    2013-01-01

    We demonstrate that a scanning tunneling microscope tip can be used to manipulate the tightly bound core (d-electron) state of single Fe ions embedded in GaAs. Increasing tip-sample voltage removes one d electron from the core of a single Fe, changing the dopant from the (Fe2+)(-) ionized acceptor

  3. A hybrid scanning force and light microscope for surface imaging and three-dimensional optical sectioning in differential interference contrast.

    Science.gov (United States)

    Stemmer, A

    1995-04-01

    The design of a scanned-cantilever-type force microscope is presented which is fully integrated into an inverted high-resolution video-enhanced light microscope. This set-up allows us to acquire thin optical sections in differential interference contrast (DIC) or polarization while the force microscope is in place. Such a hybrid microscope provides a unique platform to study how cell surface properties determine, or are affected by, the three-dimensional dynamic organization inside the living cell. The hybrid microscope presented in this paper has proven reliable and versatile for biological applications. It is the only instrument that can image a specimen by force microscopy and high-power DIC without having either to translate the specimen or to remove the force microscope. Adaptation of the design features could greatly enhance the suitability of other force microscopes for biological work.

  4. Optical method for distance and displacement measurements of the probe-sample separation in a scanning near-field optical microscope

    International Nuclear Information System (INIS)

    Santamaria, L.; Siller, H. R.; Garcia-Ortiz, C. E.; Cortes, R.; Coello, V.

    2016-01-01

    In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image processing and numerical analysis. The technique can also be strategically combined with the characterization of piezoelectric actuators and stability evaluation of the optical system. It also opens the possibility for the development of an automatic approximation control system valid for probe-sample distances from 5 to 500 μm.

  5. Optical method for distance and displacement measurements of the probe-sample separation in a scanning near-field optical microscope

    Energy Technology Data Exchange (ETDEWEB)

    Santamaria, L.; Siller, H. R. [Tecnológico de Monterrey, Eugenio Garza Sada 2501 Sur, Monterrey, N.L., 64849 (Mexico); Garcia-Ortiz, C. E., E-mail: cegarcia@cicese.mx [CONACYT Research Fellow – CICESE, Unidad Monterrey, Alianza Centro 504, Apodaca, NL, 66629 (Mexico); Cortes, R.; Coello, V. [CICESE, Unidad Monterrey, PIIT, Alianza Centro 504, Apodaca, NL, 66629 (Mexico)

    2016-04-15

    In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image processing and numerical analysis. The technique can also be strategically combined with the characterization of piezoelectric actuators and stability evaluation of the optical system. It also opens the possibility for the development of an automatic approximation control system valid for probe-sample distances from 5 to 500 μm.

  6. STM-SQUID probe microscope

    International Nuclear Information System (INIS)

    Hayashi, Tadayuki; Tachiki, Minoru; Itozaki, Hideo

    2007-01-01

    We have developed a STM-SQUID probe microscope. A high T C SQUID probe microscope was combined with a scanning tunneling microscope for investigation of samples at room temperature in air. A high permeability probe needle was used as a magnetic flux guide to improve the spatial resolution. The probe with tip radius of less than 100 nm was prepared by microelectropolishing. The probe was also used as a scanning tunneling microscope tip. Topography of the sample surface could be measured by the scanning tunneling microscope with high spatial resolution prior to observation by SQUID microscopy. The SQUID probe microscope image could be observed while keeping the distance from the sample surface to the probe tip constant. We observed a topographic image and a magnetic image of Ni fine pattern and also a magnetically recorded hard disk. Furthermore we have investigated a sample vibration method of the static magnetic field emanating from a sample with the aim of achieving a higher signal-to-noise (S/N) ratio

  7. Using the scanning electron microscope and energy dispersive x-ray spectrometer to do mineral identification and compositional point counting on unconsolidated marine sediments

    International Nuclear Information System (INIS)

    Robson, S.H.

    1982-01-01

    This paper describes a rapid and accurate method of point-counting sands and silt-size in unconsolidated open-ocean sediments. As traditional techniques for this operation cannot be employed on the fine-grained material which frequently forms the bulk of deep sea marine sediments, an alternative method has been sought. The method described makes use of equipment known as QUANTEX-RAY comprising a computerised data acquisition and reduction system designed for use in X-ray energy spectrometry and used in conjunction with a scanning electron microscope (SEM). Grains that cannot be identified by their visual morphology in the scanning electron microscope are analysed by X-ray spectrometry. Spectra are acquired in 200 seconds or less and processed by a sequence of software routines under semi-automatic control producing a listing of oxide concentrations as the final result. Each user must customize the control programme and operating conditions to suit his requirements

  8. Trichomes of Cannabis sativa as viewed with scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ledbetter, M C; Krikorian, A D

    1975-06-01

    Direct examination of fresh, unfixed and uncoated specimens from vegetative and floral parts of Cannabis sativa with the scanning electron microscope enables one to obtain a faithful representation of their surface morphology. The presence of two major types of trichomes has been confirmed: a glandular type comprising or terminating in a globoid structure, and a conically-shaped nonglandular type. Moreover, three or possibly four distinct glandular types can be distinguished: sessile globoid, small-stalked and large-stalked globoid, and a peltate type. The nonglandular trichomes can be distinguished by the nature of their surfaces: those with a warty surface, and those which are relatively smooth. The range of size and distribution, and the special features of all these types of trichomes are also provided.

  9. Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Miller, Thomas Martin [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Patton, Bruce W. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Weber, Charles F. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Bekar, Kursat B. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

    2014-10-01

    The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

  10. Development of a scanning transmission x-ray microscope for the beamline P04 at PETRA III DESY

    International Nuclear Information System (INIS)

    Andrianov, Konstantin; Ewald, Johannes; Nisius, Thomas; Wilhein, Thomas; Lühl, Lars; Malzer, Wolfgang; Kanngießer, Birgit

    2016-01-01

    We present a scanning transmission x-ray microscope (STXM) built on top of our existing modular platform for high resolution imaging experiments. This platform consists of up to three separate vacuum chambers and custom designed piezo stages. These piezo stages are able to move precisely in x-, y- and z-direction, this makes it possible to adjust the components for different imaging modes. During recent experiments the endstation was operated mainly as a transmission x-ray microscope (TXM) [1, 2

  11. A low-temperature scanning tunneling microscope capable of microscopy and spectroscopy in a Bitter magnet at up to 34 T.

    Science.gov (United States)

    Tao, W; Singh, S; Rossi, L; Gerritsen, J W; Hendriksen, B L M; Khajetoorians, A A; Christianen, P C M; Maan, J C; Zeitler, U; Bryant, B

    2017-09-01

    We present the design and performance of a cryogenic scanning tunneling microscope (STM) which operates inside a water-cooled Bitter magnet, which can attain a magnetic field of up to 38 T. Due to the high vibration environment generated by the magnet cooling water, a uniquely designed STM and a vibration damping system are required. The STM scan head is designed to be as compact and rigid as possible, to minimize the effect of vibrational noise as well as fit the size constraints of the Bitter magnet. The STM uses a differential screw mechanism for coarse tip-sample approach, and operates in helium exchange gas at cryogenic temperatures. The reliability and performance of the STM are demonstrated through topographic imaging and scanning tunneling spectroscopy on highly oriented pyrolytic graphite at T = 4.2 K and in magnetic fields up to 34 T.

  12. A scanning tunneling microscope break junction method with continuous bias modulation.

    Science.gov (United States)

    Beall, Edward; Yin, Xing; Waldeck, David H; Wierzbinski, Emil

    2015-09-28

    Single molecule conductance measurements on 1,8-octanedithiol were performed using the scanning tunneling microscope break junction method with an externally controlled modulation of the bias voltage. Application of an AC voltage is shown to improve the signal to noise ratio of low current (low conductance) measurements as compared to the DC bias method. The experimental results show that the current response of the molecule(s) trapped in the junction and the solvent media to the bias modulation can be qualitatively different. A model RC circuit which accommodates both the molecule and the solvent is proposed to analyze the data and extract a conductance for the molecule.

  13. A compact atomic force-scanning tunneling microscope for studying microelectronics and environmental aerosols

    International Nuclear Information System (INIS)

    Chen, G.

    1996-06-01

    This dissertation describes the characteristics and the construction of a compact atomic force/scanning tunneling microscope (AFM/STM). The basics and the method of preparing a tunneling junction between a chemically etched tunneling tip and a micro-manufactured cantilever is outlined by analyzing the forces between tunneling tip and cantilever as well as between force-sensing tip and sample surfaces. To our best knowledge this instrument is the first one using a commercial cantilever with only one piezoelectric tube carrying the whole tunneling sensor. The feedback control system has been optimized after a careful analysis of the electronic loop characteristics. The mode of operation has been determined by analyzing the dynamic characteristics of the scan heads and by investigating the time characteristics of the data acquisition system. The vibration isolation system has been calibrated by analyzing the characteristics of the damping setup and the stiffness of the scan head. The calculated results agree well with the measured ones. Also, a software package for data acquisition and real time display as well as for image processing and three-dimensional visualization has been developed. With this home-made software package, the images can be processed by means of a convolution filter, a Wiener filter and other 2-D FFT filters, and can be displayed in different ways. Atomic resolution images of highly oriented pyrolytic graphite (HOPG) and graphite surfaces have been obtained in AFM and STM mode. New theoretical explanations have been given for the observed anomalous STM and AFM images of graphite by calculating the asymmetric distribution of quantum conductance and tip-surface forces on a graphite surface. This not only resolved the theoretical puzzles of STM and AFM of graphite, but also revealed the relation between atomic force microscopy and scanning tunneling microscopy of graphite. Applications of STM and AFM to micro-electronic devices have been investigated

  14. Precise Orientation of a Single C60 Molecule on the Tip of a Scanning Probe Microscope

    Science.gov (United States)

    Chiutu, C.; Sweetman, A. M.; Lakin, A. J.; Stannard, A.; Jarvis, S.; Kantorovich, L.; Dunn, J. L.; Moriarty, P.

    2012-06-01

    We show that the precise orientation of a C60 molecule which terminates the tip of a scanning probe microscope can be determined with atomic precision from submolecular contrast images of the fullerene cage. A comparison of experimental scanning tunneling microscopy data with images simulated using computationally inexpensive Hückel theory provides a robust method of identifying molecular rotation and tilt at the end of the probe microscope tip. Noncontact atomic force microscopy resolves the atoms of the C60 cage closest to the surface for a range of molecular orientations at tip-sample separations where the molecule-substrate interaction potential is weakly attractive. Measurements of the C60C60 pair potential acquired using a fullerene-terminated tip are in excellent agreement with theoretical predictions based on a pairwise summation of the van der Waals interactions between C atoms in each cage, i.e., the Girifalco potential [L. Girifalco, J. Phys. Chem. 95, 5370 (1991)JPCHAX0022-365410.1021/j100167a002].

  15. A high stability and repeatability electrochemical scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Xia, Zhigang; Wang, Jihao; Lu, Qingyou, E-mail: qxl@ustc.edu.cn [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China); Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China); Hou, Yubin [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China)

    2014-12-15

    We present a home built electrochemical scanning tunneling microscope (ECSTM) with very high stability and repeatability. Its coarse approach is driven by a closely stacked piezo motor of GeckoDrive type with four rigid clamping points, which enhances the rigidity, compactness, and stability greatly. It can give high clarity atomic resolution images without sound and vibration isolations. Its drifting rates in XY and Z directions in solution are as low as 84 pm/min and 59 pm/min, respectively. In addition, repeatable coarse approaches in solution within 2 mm travel distance show a lateral deviation less than 50 nm. The gas environment can be well controlled to lower the evaporation rate of the cell, thus reducing the contamination and elongating the measurement time. Atomically resolved SO{sub 4}{sup 2−} image on Au (111) work electrode is demonstrated to show the performance of the ECSTM.

  16. Scanning microscopic four-point conductivity probes

    DEFF Research Database (Denmark)

    Petersen, Christian Leth; Hansen, Torben Mikael; Bøggild, Peter

    2002-01-01

    A method for fabricating microscopic four-point probes is presented. The method uses silicon-based microfabrication technology involving only two patterning steps. The last step in the fabrication process is an unmasked deposition of the conducting probe material, and it is thus possible to select...... the conducting material either for a silicon wafer or a single probe unit. Using shadow masking photolithography an electrode spacing (pitch) down to 1.1 mum was obtained, with cantilever separation down to 200 run. Characterisation measurements have shown the microscopic probes to be mechanically very flexible...

  17. Nitrogen implantation with a scanning electron microscope.

    Science.gov (United States)

    Becker, S; Raatz, N; Jankuhn, St; John, R; Meijer, J

    2018-01-08

    Established techniques for ion implantation rely on technically advanced and costly machines like particle accelerators that only few research groups possess. We report here about a new and surprisingly simple ion implantation method that is based upon a widespread laboratory instrument: The scanning electron microscope. We show that it can be utilized to ionize atoms and molecules from the restgas by collisions with electrons of the beam and subsequently accelerate and implant them into an insulating sample by the effect of a potential building up at the sample surface. Our method is demonstrated by the implantation of nitrogen ions into diamond and their subsequent conversion to nitrogen vacancy centres which can be easily measured by fluorescence confocal microscopy. To provide evidence that the observed centres are truly generated in the way we describe, we supplied a 98% isotopically enriched 15 N gas to the chamber, whose natural abundance is very low. By employing the method of optically detected magnetic resonance, we were thus able to verify that the investigated centres are actually created from the 15 N isotopes. We also show that this method is compatible with lithography techniques using e-beam resist, as demonstrated by the implantation of lines using PMMA.

  18. A novel approach for fast scanning of nuclear emulsions with continuous motion of the microscope stage

    Energy Technology Data Exchange (ETDEWEB)

    Aleksandrov, A., E-mail: andrey@na.infn.it [INFN sezione di Napoli, I-80125 Napoli (Italy); LPI - Lebedev Physical Institute of the Russian Academy of Sciences, RUS-119991 Moscow (Russian Federation); Tioukov, V. [INFN sezione di Napoli, I-80125 Napoli (Italy)

    2013-08-01

    Nuclear emulsions have been used in particle physics experiments for many decades because of their unique spatial resolution. The use of nuclear emulsions as precise tracking detectors in large experiments has recently been made possible due to advances in the production of emulsion films and to the development of very fast automatic scanning devices. The present scanning speed of the European Scanning System (ESS), which has been developed within the OPERA Collaboration, is about 20 cm{sup 2}/h. In addition to the scanning of OPERA films, the ESS is used for other applications with ever-growing demands for scanning speed, such as the muon radiography of volcanoes. In order to further increase the scanning speed of the ESS, we are testing a novel approach different from the standard stop-and-go motion of the microscope stage in the horizontal plane. Indeed we perform data acquisition with the stage moving at constant speed, using an objective lens with wide field of view. Unlike the implementation realized in Japan where the movement of objective lens and stage are synchronized to pile up images of the same view in a vertical stack, in this approach only the stage is moving horizontally. Thus images at different depths are not fully overlapped and special care is needed in the reconstruction. This approach can give a substantial increase in the scanning speed, especially for thin emulsion layers and wide field of view. In this paper we demonstrate that, after applying special corrections, the emulsion data quality can be as good as with the standard stop-and-go approach. This technique allows to double the scanning speed of the ESS, bringing it to 40 cm{sup 2}/h without any hardware modification.

  19. Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope

    International Nuclear Information System (INIS)

    Gregory, A.P.; Blackburn, J.F.; Lees, K.; Clarke, R.N.; Hodgetts, T.E.; Hanham, S.M.; Klein, N.

    2016-01-01

    In this paper improvements to a Near-Field Scanning Microwave Microscope (NSMM) are presented that allow the loss of high loss dielectric materials to be measured accurately at microwave frequencies. This is demonstrated by measuring polar liquids (loss tangent tanδ≈1) for which traceable data is available. The instrument described uses a wire probe that is electromagnetically coupled to a resonant cavity. An optical beam deflection system is incorporated within the instrument to allow contact mode between samples and the probe tip to be obtained. Liquids are contained in a measurement cell with a window of ultrathin glass. The calibration process for the microscope, which is based on image-charge electrostatic models, has been adapted to use the Laplacian ‘complex frequency’. Measurements of the loss tangent of polar liquids that are consistent with reference data were obtained following calibration against single-crystal specimens that have very low loss. - Highlights: • Design of a microwave microscope with resolution on the micron scale. • Improved theory for obtaining permittivity and loss tangent of high loss materials. • Polar reference liquids are used as test samples. • Traceable measurements with accuracy approximately ±10% in ε′ and ±20% in tan δ.

  20. Plasmon-mediated circularly polarized luminescence of GaAs in a scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Mühlenberend, Svenja; Gruyters, Markus; Berndt, Richard, E-mail: berndt@physik.uni-kiel.de [Institut für Experimentelle und Angewandte Physik, Christian-Albrechts-Universität zu Kiel, 24098 Kiel (Germany)

    2015-12-14

    The electroluminescence from p-type GaAs(110) in a scanning tunneling microscope has been investigated at 6 K. Unexpectedly, high degrees of circular polarization have often been observed with ferromagnetic Ni tips and also with paramagnetic W and Ag tips. The data are interpreted in terms of two distinct excitation mechanisms. Electron injection generates intense luminescence with low polarization. Plasmon-mediated generation of electron-hole pairs leads to less intense emission, which, however, is highly polarized for many tips.

  1. Observation of magnetic domains using a reflection-mode scanning near-field optical microscope

    OpenAIRE

    SHVETS, IGOR

    1997-01-01

    PUBLISHED It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in t...

  2. Observation of magnetic domains using a reflection mode scanning near-field optical microscope

    OpenAIRE

    Durkam, C.; Shvets, I.V.; Lodder, J.C.

    1997-01-01

    It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography...

  3. A scanning electron microscopic study of 34 cases of acute granulocytic, myelomonocytic, monoblastic and histiocytic leukemia.

    Science.gov (United States)

    Polliack, A; McKenzie, S; Gee, T; Lampen, N; de Harven, E; Clarkson, B D

    1975-09-01

    This report describes the surface architecture of leukemic cells, as seen by scanning electron microscopy in 34 patients with acute nonlymphoblastic leukemia. Six patients with myeloblastic, 4 with promyelocytic, 10 with myelomonocytic, 8 with monocytic, 4 with histiocytic and 2 with undifferentiated leukemia were studied. Under the scanning electron microscope most leukemia histiocytes and monocytes appeared similar and were characterized by the presence of large, well developed broad-based ruffled membranes or prominent raised ridge-like profiles, resembling ithis respect normal monocytes. Most cells from patients with acute promyelocytic or myeloblastic leukemia exhibited narrower ridge-like profiles whereas some showed ruffles or microvilli. Patients with myelomonocytic leukemia showed mixed populations of cells with ridge-like profiles and ruffled membranes whereas cells from two patients with undifferentiated leukemia had smooth surfaces, similar to those encountered in cells from patients with acute lymphoblastic leukemia. It appears that nonlymphoblastic and lymphoblastic leukemia cells (particularly histiocytes and monocytes) can frequently be distinquished on the basis of their surface architecture. The surface features of leukemic histiocytes and monocytes are similar, suggesting that they may belong to the same cell series. The monocytes seem to have characteristic surface features recognizable with the scanning electron microscope and differ from most cells from patients with acute granulocytic leukemia. Although overlap of surface features and misidentification can occur, scanning electron microscopy is a useful adjunct to other modes of microscopy in the study and diagnosis of acute leukemia.

  4. Spectrally resolved luminescence from an InGaAs quantum well induced by an ambient scanning tunneling microscope

    NARCIS (Netherlands)

    Kemerink, M.; Gerritsen, J.W.; Koenraad, P.M.; Kempen, van H.; Wolter, J.H.

    1999-01-01

    Spectrally resolved scanning tunneling microscope-induced luminescence has been obtained under ambient conditions, i.e., at room temperature, in air, by passivating the sample surface with sulfur. This passivation turned out to be essential to suppress the local anodic oxidation induced by the

  5. The trajectories of secondary electrons in the scanning electron microscope.

    Science.gov (United States)

    Konvalina, Ivo; Müllerová, Ilona

    2006-01-01

    Three-dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart-Thornley detector of SE and to reveal fundamental rules for tailoring the set-ups in which efficient signal acquisition can be expected. Intuitive realizations about the easiness of attracting the SEs towards the biased front grid of the detector have shown themselves likely as false, and all grounded objects in the chamber have been proven to influence the spatial distribution of the signal-extracting field. The role of the magnetic field penetrating from inside the objective lens is shown to play an ambiguous role regarding possible support for the signal collection.

  6. Common Bias Readout for TES Array on Scanning Transmission Electron Microscope

    Science.gov (United States)

    Yamamoto, R.; Sakai, K.; Maehisa, K.; Nagayoshi, K.; Hayashi, T.; Muramatsu, H.; Nakashima, Y.; Mitsuda, K.; Yamasaki, N. Y.; Takei, Y.; Hidaka, M.; Nagasawa, S.; Maehata, K.; Hara, T.

    2016-07-01

    A transition edge sensor (TES) microcalorimeter array as an X-ray sensor for a scanning transmission electron microscope system is being developed. The technical challenge of this system is a high count rate of ˜ 5000 counts/second/array. We adopted a 64 pixel array with a parallel readout. Common SQUID bias, and common TES bias are planned to reduce the number of wires and the resources of a room temperature circuit. The reduction rate of wires is 44 % when a 64 pixel array is read out by a common bias of 8 channels. The possible degradation of the energy resolution has been investigated by simulations and experiments. The bias fluctuation effects of a series connection are less than those of a parallel connection. Simple calculations expect that the fluctuations of the common SQUID bias and common TES bias in a series connection are 10^{-7} and 10^{-3}, respectively. We constructed 8 SQUIDs which are connected to 8 TES outputs and a room temperature circuit for common bias readout and evaluated experimentally. Our simulation of crosstalk indicates that at an X-ray event rate of 500 cps/pixel, crosstalk will broaden a monochromatic line by about 0.01 %, or about 1.5 eV at 15 keV. Thus, our design goal of 10 eV energy resolution across the 0.5-15 keV band should be achievable.

  7. A new variable temperature solution-solid interface scanning tunneling microscope.

    Science.gov (United States)

    Jahanbekam, Abdolreza; Mazur, Ursula; Hipps, K W

    2014-10-01

    We present a new solution-solid (SS) interface scanning tunneling microscope design that enables imaging at high temperatures with low thermal drift and with volatile solvents. In this new design, distinct from the conventional designs, the entire microscope is surrounded in a controlled-temperature and controlled-atmosphere chamber. This allows users to take measurements at high temperatures while minimizing thermal drift. By incorporating an open solution reservoir in the chamber, solvent evaporation from the sample is minimized; allowing users to use volatile solvents for temperature dependent studies at high temperatures. The new design enables the user to image at the SS interface with some volatile solvents for long periods of time (>24 h). An increase in the nonlinearity of the piezoelectric scanner in the lateral direction as a function of temperature is addressed. A temperature dependent study of cobalt(II) octaethylporphyrin (CoOEP) at the toluene/Au(111) interface has been performed with this instrument. It is demonstrated that the lattice parameters remain constant within experimental error from 24 °C to 75 °C. Similar quality images were obtained over the entire temperature range. We report the unit cell of CoOEP at the toluene/Au(111) interface (based on two molecules per unit cell) to be A = (1.36 ± 0.04) nm, B = (2.51 ± 0.04) nm, and α = 97° ± 2°.

  8. Patterning a hydrogen-bonded molecular monolayer with a hand-controlled scanning probe microscope

    Directory of Open Access Journals (Sweden)

    Matthew F. B. Green

    2014-10-01

    Full Text Available One of the paramount goals in nanotechnology is molecular-scale functional design, which includes arranging molecules into complex structures at will. The first steps towards this goal were made through the invention of the scanning probe microscope (SPM, which put single-atom and single-molecule manipulation into practice for the first time. Extending the controlled manipulation to larger molecules is expected to multiply the potential of engineered nanostructures. Here we report an enhancement of the SPM technique that makes the manipulation of large molecular adsorbates much more effective. By using a commercial motion tracking system, we couple the movements of an operator's hand to the sub-angstrom precise positioning of an SPM tip. Literally moving the tip by hand we write a nanoscale structure in a monolayer of large molecules, thereby showing that our method allows for the successful execution of complex manipulation protocols even when the potential energy surface that governs the interaction behaviour of the manipulated nanoscale object(s is largely unknown.

  9. Function analysis of working integrated circuit with scanning laser microscope. Laser kenbikyo ni yoru IC no dosa kansatsu

    Energy Technology Data Exchange (ETDEWEB)

    Ode, T. (Lasertec Corp., Kanagawa (Japan))

    1992-10-20

    By scanning a laser light, the reaction of a specimen against the light is detected in some means. The optical effect can be visualized by displaying that on the CRT or the like in synchronism with the scanning. Among these, an image formed and visualized by internal photoelectric effect by light is called OBIC image, and chiefly used for evaluating and analyzing semiconductor devices. Observing this OBIC image by a high speed scanning laser microscope has been spotlighted these days as an effective means for observing the state of p-n junction of an IC in operation. This paper descries the principle, the observing method, the detecting circuit, etc. of the semiconductor observing method using a laser microscope. Further, actual examples of detecting defects of an IC by means of OBIC image are shown. As for the problem, since leak parts are displayed as negative contrast in the OBIC image to affect finding work of leak part, the necessity of improvement is pointed out. 39 refs., 11 figs.

  10. Advances in imaging and electron physics the scanning transmission electron microscope

    CERN Document Server

    Hawkes, Peter W

    2009-01-01

    Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians.

  11. In situ ion etching in a scanning electron microscope

    International Nuclear Information System (INIS)

    Dhariwal, R.S.; Fitch, R.K.

    1977-01-01

    A facility for ion etching in a scanning electron microscope is described which incorporates a new type of electrostatic ion source and viewing of the specimen is possible within about 30 sec after terminating the ion bombardment. Artefacts produced during etching have been studied and cone formation has been followed during its growth. The instrument has provided useful structural information on metals, alloys, and sinters. However, although insulating materials, such as plastics, glass and resins, have been successfully etched, interpretation of the resultant micrographs is more difficult. Ion etching of soft biological tissues, such as the rat duodenum was found to be of considerable interest. The observed structural features arise from the selective intake of the heavy fixation elements by different parts of the tissue. Hard biological materials, such as dental tissues and restorative materials, have also been studied and the prismatic structure of the enamel and the form and distribution of the dentinal tubules have been revealed. (author)

  12. Instrumental Developments for In-situ Breakdown Experiments inside a Scanning Electron Microscope

    CERN Document Server

    Muranaka, T; Leifer, K; Ziemann, V

    2011-01-01

    Electrical discharges in accelerating structures are one of the key issues limiting the performance of future high energy accelerators such as the Compact Linear Collider (CLIC). Fundamental understanding of breakdown phenomena is an indispensable part of the CLIC feasibility study. The present work concerns the experimental study of breakdown using Scanning Electron Microscopes (SEMs). A SEM gives us the opportunity to achieve high electrical gradients of 1\\,kV/$\\mu$m which corresponds to 1\\,GV/m by exciting a probe needle with a high voltage power supply and controlling the positioning of the needle with a linear piezo motor. The gap between the needle tip and the surface is controlled with sub-micron precision. A second electron microscope equipped with a Focused Ion Beam (FIB) is used to create surface corrugations and to sharpen the probe needle to a tip radius of about 50\\,nm. Moreover it is used to prepare cross sections of a voltage breakdown area in order to study the geometrical surface damages as w...

  13. Design of a cathodoluminescence image generator using a Raspberry Pi coupled to a scanning electron microscope

    Science.gov (United States)

    Benítez, Alfredo; Santiago, Ulises; Sanchez, John E.; Ponce, Arturo

    2018-01-01

    In this work, an innovative cathodoluminescence (CL) system is coupled to a scanning electron microscope and synchronized with a Raspberry Pi computer integrated with an innovative processing signal. The post-processing signal is based on a Python algorithm that correlates the CL and secondary electron (SE) images with a precise dwell time correction. For CL imaging, the emission signal is collected through an optical fiber and transduced to an electrical signal via a photomultiplier tube (PMT). CL Images are registered in a panchromatic mode and can be filtered using a monochromator connected between the optical fiber and the PMT to produce monochromatic CL images. The designed system has been employed to study ZnO samples prepared by electrical arc discharge and microwave methods. CL images are compared with SE images and chemical elemental mapping images to correlate the emission regions of the sample.

  14. Current–Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope

    Science.gov (United States)

    2013-01-01

    Utilizing semiconductor nanowires for (opto)electronics requires exact knowledge of their current–voltage properties. We report accurate on-top imaging and I–V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no need for additional microscopy tools, thus allowing versatile application. We form Ohmic contacts to InP and InAs nanowires without any sample processing, followed by quantitative measurements of diameter dependent I–V properties with a very small spread in measured values compared to standard techniques. PMID:24059470

  15. Current-voltage characterization of individual as-grown nanowires using a scanning tunneling microscope.

    Science.gov (United States)

    Timm, Rainer; Persson, Olof; Engberg, David L J; Fian, Alexander; Webb, James L; Wallentin, Jesper; Jönsson, Andreas; Borgström, Magnus T; Samuelson, Lars; Mikkelsen, Anders

    2013-11-13

    Utilizing semiconductor nanowires for (opto)electronics requires exact knowledge of their current-voltage properties. We report accurate on-top imaging and I-V characterization of individual as-grown nanowires, using a subnanometer resolution scanning tunneling microscope with no need for additional microscopy tools, thus allowing versatile application. We form Ohmic contacts to InP and InAs nanowires without any sample processing, followed by quantitative measurements of diameter dependent I-V properties with a very small spread in measured values compared to standard techniques.

  16. Miniature in vivo MEMS-based line-scanned dual-axis confocal microscope for point-of-care pathology

    Science.gov (United States)

    Yin, C.; Glaser, A.K.; Leigh, S. Y.; Chen, Y.; Wei, L.; Pillai, P. C. S.; Rosenberg, M. C.; Abeytunge, S.; Peterson, G.; Glazowski, C.; Sanai, N.; Mandella, M. J.; Rajadhyaksha, M.; Liu, J. T. C.

    2016-01-01

    There is a need for miniature optical-sectioning microscopes to enable in vivo interrogation of tissues as a real-time and noninvasive alternative to gold-standard histopathology. Such devices could have a transformative impact for the early detection of cancer as well as for guiding tumor-resection procedures. Miniature confocal microscopes have been developed by various researchers and corporations to enable optical sectioning of highly scattering tissues, all of which have necessitated various trade-offs in size, speed, depth selectivity, field of view, resolution, image contrast, and sensitivity. In this study, a miniature line-scanned (LS) dual-axis confocal (DAC) microscope, with a 12-mm diameter distal tip, has been developed for clinical point-of-care pathology. The dual-axis architecture has demonstrated an advantage over the conventional single-axis confocal configuration for reducing background noise from out-of-focus and multiply scattered light. The use of line scanning enables fast frame rates (16 frames/sec is demonstrated here, but faster rates are possible), which mitigates motion artifacts of a hand-held device during clinical use. We have developed a method to actively align the illumination and collection beams in a DAC microscope through the use of a pair of rotatable alignment mirrors. Incorporation of a custom objective lens, with a small form factor for in vivo clinical use, enables our device to achieve an optical-sectioning thickness and lateral resolution of 2.0 and 1.1 microns respectively. Validation measurements with reflective targets, as well as in vivo and ex vivo images of tissues, demonstrate the clinical potential of this high-speed optical-sectioning microscopy device. PMID:26977337

  17. Three-dimensional reconstruction of highly complex microscopic samples using scanning electron microscopy and optical flow estimation.

    Directory of Open Access Journals (Sweden)

    Ahmadreza Baghaie

    Full Text Available Scanning Electron Microscope (SEM as one of the major research and industrial equipment for imaging of micro-scale samples and surfaces has gained extensive attention from its emerge. However, the acquired micrographs still remain two-dimensional (2D. In the current work a novel and highly accurate approach is proposed to recover the hidden third-dimension by use of multi-view image acquisition of the microscopic samples combined with pre/post-processing steps including sparse feature-based stereo rectification, nonlocal-based optical flow estimation for dense matching and finally depth estimation. Employing the proposed approach, three-dimensional (3D reconstructions of highly complex microscopic samples were achieved to facilitate the interpretation of topology and geometry of surface/shape attributes of the samples. As a byproduct of the proposed approach, high-definition 3D printed models of the samples can be generated as a tangible means of physical understanding. Extensive comparisons with the state-of-the-art reveal the strength and superiority of the proposed method in uncovering the details of the highly complex microscopic samples.

  18. Development of new techniques for scanning electron microscope observation using ionic liquid

    Energy Technology Data Exchange (ETDEWEB)

    Arimoto, Satoshi; Sugimura, Masaharu; Kageyama, Hitoshi [Department of Applied Chemistry, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871 (Japan); JST, CREST, Kawaguchi, Saitama 332-0012 (Japan); Torimoto, Tsukasa [Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603 (Japan); JST, CREST, Kawaguchi, Saitama 332-0012 (Japan); Kuwabata, Susumu [Department of Applied Chemistry, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871 (Japan); JST, CREST, Kawaguchi, Saitama 332-0012 (Japan)], E-mail: kuwabata@chem.eng.osaka-u.ac.jp

    2008-09-01

    Based on our previous discovery that ionic liquid (IL) can be observed by a scanning electron microscope (SEM) without charging the liquid, we have developed several novel techniques for SEM observation. Coating of insulating sample with IL is useful for providing electronic conductivity to the samples like metal or carbon coating by vacuum vapor deposition. In this case, dilution of the IL with appropriate volatile solvent like alcohol is effective for coating thin layer of IL on the sample. As a biological sample, seaweed including IL was attempted to be observed by SEM. A seaweed leaf swollen by water was put in an IL bath and the bath was put in an outgassed desiccator to replace water in the seaweed leaf with IL. The resulting sample gave a SEM image of the swollen seaweed whose thickness was several times larger than dried one. Furthermore, the introduction of the IL in vacuum chamber allowed us to develop the in situ electrochemical SEM observation system. Using this system, we observed changes in polypyrrole film thickness caused by the redox reaction of the film and the electrochemical deposition of silver and its oxidative dissolution. It was also found that the energy dispersive X-ray fluorescence (EDX) analysis was available even for the electrode polarized in IL.

  19. Development of new techniques for scanning electron microscope observation using ionic liquid

    International Nuclear Information System (INIS)

    Arimoto, Satoshi; Sugimura, Masaharu; Kageyama, Hitoshi; Torimoto, Tsukasa; Kuwabata, Susumu

    2008-01-01

    Based on our previous discovery that ionic liquid (IL) can be observed by a scanning electron microscope (SEM) without charging the liquid, we have developed several novel techniques for SEM observation. Coating of insulating sample with IL is useful for providing electronic conductivity to the samples like metal or carbon coating by vacuum vapor deposition. In this case, dilution of the IL with appropriate volatile solvent like alcohol is effective for coating thin layer of IL on the sample. As a biological sample, seaweed including IL was attempted to be observed by SEM. A seaweed leaf swollen by water was put in an IL bath and the bath was put in an outgassed desiccator to replace water in the seaweed leaf with IL. The resulting sample gave a SEM image of the swollen seaweed whose thickness was several times larger than dried one. Furthermore, the introduction of the IL in vacuum chamber allowed us to develop the in situ electrochemical SEM observation system. Using this system, we observed changes in polypyrrole film thickness caused by the redox reaction of the film and the electrochemical deposition of silver and its oxidative dissolution. It was also found that the energy dispersive X-ray fluorescence (EDX) analysis was available even for the electrode polarized in IL

  20. Spin microscope based on optically detected magnetic resonance

    Science.gov (United States)

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  1. Color Laser Microscope

    Science.gov (United States)

    Awamura, D.; Ode, T.; Yonezawa, M.

    1987-04-01

    A color laser microscope utilizing a new color laser imaging system has been developed for the visual inspection of semiconductors. The light source, produced by three lasers (Red; He-Ne, Green; Ar, Blue; He-Cd), is deflected horizontally by an AOD (Acoustic Optical Deflector) and vertically by a vibration mirror. The laser beam is focused in a small spot which is scanned over the sample at high speed. The light reflected back from the sample is reformed to contain linear information by returning to the original vibration mirror. The linear light is guided to the CCD image sensor where it is converted into a video signal. Individual CCD image sensors are used for each of the three R, G, or B color image signals. The confocal optical system with its laser light source yields a color TV monitor image with no flaring and a much sharper resolution than that of the conventional optical microscope. The AOD makes possible a high speed laser scan and a NTSC or PAL TV video signal is produced in real time without any video memory. Since the light source is composed of R, G, and B laser beams, color separation superior to that of white light illumination is achieved. Because of the photometric linearity of the image detector, the R, G, and B outputs of the system are most suitably used for hue analysis. The CCD linear image sensors in the optical system produce no geometrical distortion, and good color registration is available principally. The output signal can be used for high accuracy line width measuring. The many features of the color laser microscope make it ideally suited for the visual inspection of semiconductor processing. A number of these systems have already been installed in such a capacity. The Color Laser Microscope can also be a very useful tool for the fields of material engineering and biotechnology.

  2. Role of scanning electron microscope )SEM) in metal failure analysis

    International Nuclear Information System (INIS)

    Shaiful Rizam Shamsudin; Hafizal Yazid; Mohd Harun; Siti Selina Abd Hamid; Nadira Kamarudin; Zaiton Selamat; Mohd Shariff Sattar; Muhamad Jalil

    2005-01-01

    Scanning electron microscope (SEM) is a scientific instrument that uses a beam of highly energetic electrons to examine the surface and phase distribution of specimens on a micro scale through the live imaging of secondary electrons (SE) and back-scattered electrons (BSE) images. One of the main activities of SEM Laboratory at MINT is for failure analysis on metal part and components. The capability of SEM is excellent for determining the root cause of metal failures such as ductility or brittleness, stress corrosion, fatigue and other types of failures. Most of our customers that request for failure analysis are from local petrochemical plants, manufacturers of automotive components, pipeline maintenance personnel and engineers who involved in the development of metal parts and component. This paper intends to discuss some of the technical concepts in failure analysis associated with SEM. (Author)

  3. Scanning tunnelling microscope light emission: Finite temperature current noise and over cut-off emission.

    Science.gov (United States)

    Kalathingal, Vijith; Dawson, Paul; Mitra, J

    2017-06-14

    The spectral distribution of light emitted from a scanning tunnelling microscope junction not only bears its intrinsic plasmonic signature but is also imprinted with the characteristics of optical frequency fluc- tuations of the tunnel current. Experimental spectra from gold-gold tunnel junctions are presented that show a strong bias (V b ) dependence, curiously with emission at energies higher than the quantum cut-off (eV b ); a component that decays monotonically with increasing bias. The spectral evolution is explained by developing a theoretical model for the power spectral density of tunnel current fluctuations, incorporating finite temperature contribution through consideration of the quantum transport in the system. Notably, the observed decay of the over cut-off emission is found to be critically associated with, and well explained in terms of the variation in junction conductance with V b . The investigation highlights the scope of plasmon-mediated light emission as a unique probe of high frequency fluctuations in electronic systems that are fundamental to the electrical generation and control of plasmons.

  4. The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory

    International Nuclear Information System (INIS)

    Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark

    2011-01-01

    Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron-solid interactions, and the basics of modern e-beam lithography.

  5. Observation of microorganism colonies using a scanning-laser-beam pH-sensing microscope

    International Nuclear Information System (INIS)

    Nakao, M.; Inoue, S.; Oishi, R.; Yoshinobu, T.; Iwasaki, H.

    1995-01-01

    The extracellular pH-distribution of colonies of Saccharomyces cerevisiae (yeast) and Escherichia coli (E. coli) were observed using a newly-developed scanning-laser-beam pH-sensing microscope. Colonies were incubated either on top of agarose plates or between the pH-sensing surface and the agar. In the latter case, colony growth was observed in-situ. The colonies could be observed within a period as short as 8 h for E. coli. The pH-distribution profiles by the colonies were found to be very sharp, in agreement with simulation results. (author)

  6. Structural and functional changes in the intenstine of irradiated and hypothermic irradiated rats : a scanning and transmission electron microscopic study

    International Nuclear Information System (INIS)

    Chaudhuri, S.; Chaudhuri, Swapna; Roy, Bijon

    1982-01-01

    Severe destructive changes in the intestine of rats following whole body exposure to gamma rays (832 rads) were observed by light microscope, scanning and transmission electron microscope studies. Hypothermia (15deg C rectal temperature) induced prior to irradiation protected the intestinal mucosa from destruction. A simultaneous study showed that glucose absorption decreased significantly in irradiated rats, whereas it was increased in hypothermic irradiated animals. (author)

  7. Commendable surface physics by means of scanning tunneling microscopy

    International Nuclear Information System (INIS)

    Besenbacher, F.; Laegsgaard, E.; Stensgard, I.

    1995-01-01

    The scanning tunneling microscope, developed at the Aarhus University (Denmark) allows taking several STM images per second, as opposite to other similar microscopes, where the typical scanning time is 0,5-1 min. This new system enables collecting of important information concerning dynamic processes on the surfaces. The Aarhus microscope is very stable, hence atomic resolution is achievable even on close-packed metallic surfaces, while it is difficult to achieve by means of the conventional STM. (EG)

  8. Improved Scanners for Microscopic Hyperspectral Imaging

    Science.gov (United States)

    Mao, Chengye

    2009-01-01

    Improved scanners to be incorporated into hyperspectral microscope-based imaging systems have been invented. Heretofore, in microscopic imaging, including spectral imaging, it has been customary to either move the specimen relative to the optical assembly that includes the microscope or else move the entire assembly relative to the specimen. It becomes extremely difficult to control such scanning when submicron translation increments are required, because the high magnification of the microscope enlarges all movements in the specimen image on the focal plane. To overcome this difficulty, in a system based on this invention, no attempt would be made to move either the specimen or the optical assembly. Instead, an objective lens would be moved within the assembly so as to cause translation of the image at the focal plane: the effect would be equivalent to scanning in the focal plane. The upper part of the figure depicts a generic proposed microscope-based hyperspectral imaging system incorporating the invention. The optical assembly of this system would include an objective lens (normally, a microscope objective lens) and a charge-coupled-device (CCD) camera. The objective lens would be mounted on a servomotor-driven translation stage, which would be capable of moving the lens in precisely controlled increments, relative to the camera, parallel to the focal-plane scan axis. The output of the CCD camera would be digitized and fed to a frame grabber in a computer. The computer would store the frame-grabber output for subsequent viewing and/or processing of images. The computer would contain a position-control interface board, through which it would control the servomotor. There are several versions of the invention. An essential feature common to all versions is that the stationary optical subassembly containing the camera would also contain a spatial window, at the focal plane of the objective lens, that would pass only a selected portion of the image. In one version

  9. The use of Scanning Tunneling Microscope as a novel characterization tool for metallic alloys

    International Nuclear Information System (INIS)

    Brezenitsky, M.; Moreh, R.; Dayan, D.; Kimmel, G.

    1996-01-01

    A novel method is reported for characterizing the microstructure of metals and alloys by utilizing the surface imaging properties of a STM (Scanning Tunneling microscope). In the present work there is no need to take advantage of the high atomic resolution of the STM, instead only gross resolution is required. Twenty different samples having different grain sizes (caused by the mosaic structure) and ranging between 20 to 200 nm were prepared. These dimensions are far below the resolution limit of optical microscopes. The samples were first studied using line profile analysis of XRD spectra while focusing on two of the most characteristic properties of steel which are: grain size and the deviation from cubic symmetry. Some of the samples showed nonuniform XRD line broadening effects, which could be attributed to a tetragonal distortion. If it is true, the samples must consist of martensitic twinned structure, as a result of the typical y to a shear transformation in steels. The samples were then studied using the STM. In general, many 1000 nm x 1000 )zm STM scans were carried out on each sample. In all cases of irregular XRD line broadening, the STM identified bands and sub-bands in the images which fitted the usual twining structure in steels. In addition, the STM images were found to show individual domains, from which histograms of the grain dimensions for each sample were prepared and compared to the XRD data. An excellent agreement was observed between tile two sets of data of grain sizes. The present method is much simpler than that which employs the Transmission Electron Microscope (TEM) as it can be carried out in air and no special requirements on sample preparation is necessary. This work establishes the STM as a very useful characterization tool for studies in metallurgy and metal physics. (author)

  10. Microwave Frequency Comb from a Semiconductor in a Scanning Tunneling Microscope.

    Science.gov (United States)

    Hagmann, Mark J; Yarotski, Dmitry A; Mousa, Marwan S

    2017-04-01

    Quasi-periodic excitation of the tunneling junction in a scanning tunneling microscope, by a mode-locked ultrafast laser, superimposes a regular sequence of 15 fs pulses on the DC tunneling current. In the frequency domain, this is a frequency comb with harmonics at integer multiples of the laser pulse repetition frequency. With a gold sample the 200th harmonic at 14.85 GHz has a signal-to-noise ratio of 25 dB, and the power at each harmonic varies inversely with the square of the frequency. Now we report the first measurements with a semiconductor where the laser photon energy must be less than the bandgap energy of the semiconductor; the microwave frequency comb must be measured within 200 μm of the tunneling junction; and the microwave power is 25 dB below that with a metal sample and falls off more rapidly at the higher harmonics. Our results suggest that the measured attenuation of the microwave harmonics is sensitive to the semiconductor spreading resistance within 1 nm of the tunneling junction. This approach may enable sub-nanometer carrier profiling of semiconductors without requiring the diamond nanoprobes in scanning spreading resistance microscopy.

  11. High-stability cryogenic scanning tunneling microscope based on a closed-cycle cryostat

    Energy Technology Data Exchange (ETDEWEB)

    Hackley, Jason D.; Kislitsyn, Dmitry A.; Beaman, Daniel K.; Nazin, George V., E-mail: gnazin@uoregon.edu [Department of Chemistry and Biochemistry, 1253 University of Oregon, Eugene, Oregon 97403 (United States); Ulrich, Stefan [RHK Technology, Inc., 1050 East Maple Road, Troy, Michigan 48083 (United States)

    2014-10-15

    We report on the design and operation of a cryogenic ultra-high vacuum (UHV) scanning tunneling microscope (STM) coupled to a closed-cycle cryostat (CCC). The STM is thermally linked to the CCC through helium exchange gas confined inside a volume enclosed by highly flexible rubber bellows. The STM is thus mechanically decoupled from the CCC, which results in a significant reduction of the mechanical noise transferred from the CCC to the STM. Noise analysis of the tunneling current shows current fluctuations up to 4% of the total current, which translates into tip-sample distance variations of up to 1.5 picometers. This noise level is sufficiently low for atomic-resolution imaging of a wide variety of surfaces. To demonstrate this, atomic-resolution images of Au(111) and NaCl(100)/Au(111) surfaces, as well as of carbon nanotubes deposited on Au(111), were obtained. Thermal drift analysis showed that under optimized conditions, the lateral stability of the STM scanner can be as low as 0.18 Å/h. Scanning Tunneling Spectroscopy measurements based on the lock-in technique were also carried out, and showed no detectable presence of noise from the closed-cycle cryostat. Using this cooling approach, temperatures as low as 16 K at the STM scanner have been achieved, with the complete cool-down of the system typically taking up to 12 h. These results demonstrate that the constructed CCC-coupled STM is a highly stable instrument capable of highly detailed spectroscopic investigations of materials and surfaces at the atomic scale.

  12. High-stability cryogenic scanning tunneling microscope based on a closed-cycle cryostat.

    Science.gov (United States)

    Hackley, Jason D; Kislitsyn, Dmitry A; Beaman, Daniel K; Ulrich, Stefan; Nazin, George V

    2014-10-01

    We report on the design and operation of a cryogenic ultra-high vacuum (UHV) scanning tunneling microscope (STM) coupled to a closed-cycle cryostat (CCC). The STM is thermally linked to the CCC through helium exchange gas confined inside a volume enclosed by highly flexible rubber bellows. The STM is thus mechanically decoupled from the CCC, which results in a significant reduction of the mechanical noise transferred from the CCC to the STM. Noise analysis of the tunneling current shows current fluctuations up to 4% of the total current, which translates into tip-sample distance variations of up to 1.5 picometers. This noise level is sufficiently low for atomic-resolution imaging of a wide variety of surfaces. To demonstrate this, atomic-resolution images of Au(111) and NaCl(100)/Au(111) surfaces, as well as of carbon nanotubes deposited on Au(111), were obtained. Thermal drift analysis showed that under optimized conditions, the lateral stability of the STM scanner can be as low as 0.18 Å/h. Scanning Tunneling Spectroscopy measurements based on the lock-in technique were also carried out, and showed no detectable presence of noise from the closed-cycle cryostat. Using this cooling approach, temperatures as low as 16 K at the STM scanner have been achieved, with the complete cool-down of the system typically taking up to 12 h. These results demonstrate that the constructed CCC-coupled STM is a highly stable instrument capable of highly detailed spectroscopic investigations of materials and surfaces at the atomic scale.

  13. Scanning electron microscope investigations of nuclear pore filters in polyester foils

    International Nuclear Information System (INIS)

    Hopfe, J.

    1980-01-01

    In order to understand and characterize the action of nuclear pore filters it is necessary to know their surface, as well as their bulk, structure. In the present work, investigations of the surface structure (pore size, pore density, pore distribution) and of the pore geometry, especially in the bulk of the filters, are carried out by scanning electron microscopic (SEM) studies. The preparation technique needed is liquid-nitrogen freeze-fracturing followed by a conductive-coating step. Nuclear pore filters studied in this paper were produced by a track etching technique. Laboratory specimens were obtained by bombarding 10 μm thick polyester foils with Xe-ions and a subsequent etching with 20% NaOH. The SEM results are shown and discussed. (author)

  14. Transport properties of magnetic atom bridges controlled by a scanning tunneling microscope

    International Nuclear Information System (INIS)

    Nakanishi, H.; Kishi, T.; Kasai, H.; Komori, F.; Okiji, A.

    2003-01-01

    We have investigated the transport and magnetic properties of the atom bridge made from magnetic materials, which is the atom-scale wire constructed between a scanning tunneling microscope (STM) tip and a solid surface, by the use of ab initio calculations. In the case of the twisted ladder structure atom bridge made of Fe, we have found that the magnetic state of the bridge changes from ferromagnetic to paramagnetic, as we compress the bridge in length. We report the spin dependent quantized conductance of the bridge. And we discuss the origin of a change in transport properties as we compress the bridge in length

  15. Scanning capacitance microscope as a tool for the characterization of integrated circuits

    Science.gov (United States)

    Born, A.; Wiesendanger, R.

    With the decreasing size of integrated circuits (ICs), there is an increasing demand for the measurement of doping profiles with high spatial resolution. The scanning capacitance microscope (SCM) offers the possibility of measuring 2D dopant profiles with spatial resolution of less than 20 nm. A great problem of the SCM technique is the influence of previous measurements on subsequent ones. We have observed hysteresis in the SCM images and measured low-frequency C-V curves with high-frequency equipment. A theoretical model was developed to understand this phenomenon. We are now undertaking the first steps using the SCM as a standard device for the characterization of ICs.

  16. Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector.

    Science.gov (United States)

    Morishita, Shigeyuki; Ishikawa, Ryo; Kohno, Yuji; Sawada, Hidetaka; Shibata, Naoya; Ikuhara, Yuichi

    2018-02-01

    The achievement of a fine electron probe for high-resolution imaging in scanning transmission electron microscopy requires technological developments, especially in electron optics. For this purpose, we developed a microscope with a fifth-order aberration corrector that operates at 300 kV. The contrast flat region in an experimental Ronchigram, which indicates the aberration-free angle, was expanded to 70 mrad. By using a probe with convergence angle of 40 mrad in the scanning transmission electron microscope at 300 kV, we attained the spatial resolution of 40.5 pm, which is the projected interatomic distance between Ga-Ga atomic columns of GaN observed along [212] direction.

  17. QUANTIFICATION OF BIOFILMS IN MULTI-SPECTRAL DIGITAL1 VOLUMES FROM CONFOCAL LASER-SCANNING MICROSCOPES

    Directory of Open Access Journals (Sweden)

    Karsten Rodenacker

    2011-05-01

    Full Text Available Populations of bacteria in sludge flocs and biofilm marked by fluorescence marked with fluorescent probes are digitised with a confocal laser scanning microscope. These data are used to analyse the microbial community structure, to obtain information on the localisation of specific bacterial groups and to examine gene expression. This information is urgently required for an in-depth understanding of the function and, more generally, the microbial ecology of biofilms. Methods derived from quantitative image analysis are applied to digitised data from confocal laser scanning microscopes to obtain quantitative descriptions of volumetric, topological (and topographical properties of different compartments of the components under research. In addition to free-moving flocs, also biofilms attached to a substratum in an experimental environment are analysed. Growth form as well as interaction of components are quantitatively described. Classical measurements of volume and intensity (shape, distribution and distance dependent interaction measurements using methods from mathematical morphology are performed. Mainly image (volume processing methods are outlined. Segmented volumes are globally and individually (in terms of 3Dconnected components measured and used for distance mapping transform as well as for estimation of geodesic distances from the substrate. All transformations are applied on the 3D data set. Resulting distance distributions are quantified and related to information on the identity and activity of the probe-identified bacteria.

  18. Revealing the 1 nm/s Extensibility of Nanoscale Amorphous Carbon in a Scanning Electron Microscope

    DEFF Research Database (Denmark)

    Zhang, Wei

    2013-01-01

    In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformation...... promoted by the electric field, which resulted from an inner secondary electron potential difference from the main trunk of carbon film to the tip end of branches under electron beam. This result demonstrates importance of applying electrical effects to modify properties of carbon materials. It may have...... positive implications to explore some amorphous carbon as electron field emission device. SCANNING 35: 261-264, 2013. © 2012 Wiley Periodicals, Inc....

  19. Tunneling rates in electron transport through double-barrier molecular junctions in a scanning tunneling microscope

    OpenAIRE

    Nazin, G. V.; Wu, S. W.; Ho, W.

    2005-01-01

    The scanning tunneling microscope enables atomic-scale measurements of electron transport through individual molecules. Copper phthalocyanine and magnesium porphine molecules adsorbed on a thin oxide film grown on the NiAl(110) surface were probed. The single-molecule junctions contained two tunneling barriers, vacuum gap, and oxide film. Differential conductance spectroscopy shows that electron transport occurs via vibronic states of the molecules. The intensity of spectral peaks correspondi...

  20. A compact sub-Kelvin ultrahigh vacuum scanning tunneling microscope with high energy resolution and high stability.

    Science.gov (United States)

    Zhang, L; Miyamachi, T; Tomanić, T; Dehm, R; Wulfhekel, W

    2011-10-01

    We designed a scanning tunneling microscope working at sub-Kelvin temperatures in ultrahigh vacuum (UHV) in order to study the magnetic properties on the nanoscale. An entirely homebuilt three-stage cryostat is used to cool down the microscope head. The first stage is cooled with liquid nitrogen, the second stage with liquid (4)He. The third stage uses a closed-cycle Joule-Thomson refrigerator of a cooling power of 1 mW. A base temperature of 930 mK at the microscope head was achieved using expansion of (4)He, which can be reduced to ≈400 mK when using (3)He. The cryostat has a low liquid helium consumption of only 38 ml/h and standing times of up to 280 h. The fast cooling down of the samples (3 h) guarantees high sample throughput. Test experiments with a superconducting tip show a high energy resolution of 0.3 meV when performing scanning tunneling spectroscopy. The vertical stability of the tunnel junction is well below 1 pm (peak to peak) and the electric noise floor of tunneling current is about 6fA/√Hz. Atomic resolution with a tunneling current of 1 pA and 1 mV was achieved on Au(111). The lateral drift of the microscope at stable temperature is below 20 pm/h. A superconducting spilt-coil magnet allows to apply an out-of-plane magnetic field of up to 3 T at the sample surface. The flux vortices of a Nb(110) sample were clearly resolved in a map of differential conductance at 1.1 K and a magnetic field of 0.21 T. The setup is designed for in situ preparation of tip and samples under UHV condition.

  1. Preparation of theoretical scanning tunneling microscope images of adsorbed molecules: a theoretical study of benzene on the Cu(110) surface

    International Nuclear Information System (INIS)

    Shapter, J.G.; Rogers, B.L.; Ford, M.J.

    2003-01-01

    Full text: Since its development in 1982, the Scanning Tunneling Microscope (STM) has developed into a powerful tool for the study of surfaces and adsorbates. However, the utility of the technique can be further enhanced through the development of techniques for generating theoretical STM images. This is particularly true when studying molecules adsorbed on a substrate, as the results are often interpreted superficially due to an inadequate understanding of the orbital overlap probed in the experiment. A method of preparing theoretical scanning tunneling microscope (STM) images using comparatively inexpensive desktop computers and the commercially available CRYSTAL98 package is presented through a study of benzene adsorbed on the Cu(110) surface. Density Functional Theory (DFT) and Hartree-Fock (HF) methods are used to model clean Cu(110) slabs of various thicknesses and to simulate the adsorption of benzene onto these slabs. Eight possible orientations of benzene on the Cu(110) surface are proposed, and the optimum orientation according to the calculations is presented. Theoretical STM images of the Cu(110) surface and benzene adsorbed on the Cu(110) surface are compared with experimental STM images of the system from a published study. Significant differences are observed and are examined in detail

  2. Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope

    Czech Academy of Sciences Publication Activity Database

    Hanzelka, Pavel; Vonka, J.; Musilová, Věra

    2013-01-01

    Roč. 84, č. 8 (2013), 085103:1-6 ISSN 0034-6748 R&D Projects: GA MŠk ED0017/01/01; GA TA ČR TE01020233 Institutional support: RVO:68081731 Keywords : Thermal conductiviy * Scanning tunneling microscope Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 1.584, year: 2013

  3. Design and performance of an ultra-high vacuum spin-polarized scanning tunneling microscope operating at 30 mK and in a vector magnetic field.

    Science.gov (United States)

    von Allwörden, Henning; Eich, Andreas; Knol, Elze J; Hermenau, Jan; Sonntag, Andreas; Gerritsen, Jan W; Wegner, Daniel; Khajetoorians, Alexander A

    2018-03-01

    We describe the design and performance of a scanning tunneling microscope (STM) that operates at a base temperature of 30 mK in a vector magnetic field. The cryogenics is based on an ultra-high vacuum (UHV) top-loading wet dilution refrigerator that contains a vector magnet allowing for fields up to 9 T perpendicular and 4 T parallel to the sample. The STM is placed in a multi-chamber UHV system, which allows in situ preparation and exchange of samples and tips. The entire system rests on a 150-ton concrete block suspended by pneumatic isolators, which is housed in an acoustically isolated and electromagnetically shielded laboratory optimized for extremely low noise scanning probe measurements. We demonstrate the overall performance by illustrating atomic resolution and quasiparticle interference imaging and detail the vibrational noise of both the laboratory and microscope. We also determine the electron temperature via measurement of the superconducting gap of Re(0001) and illustrate magnetic field-dependent measurements of the spin excitations of individual Fe atoms on Pt(111). Finally, we demonstrate spin resolution by imaging the magnetic structure of the Fe double layer on W(110).

  4. Design and performance of an ultra-high vacuum spin-polarized scanning tunneling microscope operating at 30 mK and in a vector magnetic field

    Science.gov (United States)

    von Allwörden, Henning; Eich, Andreas; Knol, Elze J.; Hermenau, Jan; Sonntag, Andreas; Gerritsen, Jan W.; Wegner, Daniel; Khajetoorians, Alexander A.

    2018-03-01

    We describe the design and performance of a scanning tunneling microscope (STM) that operates at a base temperature of 30 mK in a vector magnetic field. The cryogenics is based on an ultra-high vacuum (UHV) top-loading wet dilution refrigerator that contains a vector magnet allowing for fields up to 9 T perpendicular and 4 T parallel to the sample. The STM is placed in a multi-chamber UHV system, which allows in situ preparation and exchange of samples and tips. The entire system rests on a 150-ton concrete block suspended by pneumatic isolators, which is housed in an acoustically isolated and electromagnetically shielded laboratory optimized for extremely low noise scanning probe measurements. We demonstrate the overall performance by illustrating atomic resolution and quasiparticle interference imaging and detail the vibrational noise of both the laboratory and microscope. We also determine the electron temperature via measurement of the superconducting gap of Re(0001) and illustrate magnetic field-dependent measurements of the spin excitations of individual Fe atoms on Pt(111). Finally, we demonstrate spin resolution by imaging the magnetic structure of the Fe double layer on W(110).

  5. Scanning electron microscope studies of adsorption and crystal growth on tungsten

    International Nuclear Information System (INIS)

    Akhter, P.

    1980-03-01

    An ultra high vacuum scanning electron microscope (UHV-SEM), equipped with additional surface science techniques (AES, RHEED, work function), has been used to study the adsorption and growth of Cs and Ag on polycrystalline and (110) single crystal of W. These are used to study the layer plus island, or Stranski-Krastanov growth mode. The technique and apparatus are described. In the temperature range of 15 0 C, a whole variety of growth phenomena in the system Ag/W(110) has been seen by SEM. Two intermediate layers are followed by island growth, except at T > approximately equal to 500 0 C where island growth starts at a lower coverage. At T 0 C, layer-like growth is deduced from both AES and SEM measurements. The forms, crystallographic orientations and nucleation densities of islands have been explored in detail using a combination of SEM, AES and EBSP techniques. AES results at room temperature and at 500 0 C have been analysed and the results fit very well with SEM observations. A growth model for Ag/W(110) has been presented and atomistic nucleation theory has been extended, to understand the Stranski-Krastanov growth mode in general and the Ag/W(110) results in particular. (author)

  6. Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips.

    Science.gov (United States)

    Tewari, Sumit; Bastiaans, Koen M; Allan, Milan P; van Ruitenbeek, Jan M

    2017-01-01

    Scanning tunneling microscopes (STM) are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, procedures for controlling the atomic-scale shape of STM tips have not been rigorously justified. Here, we present a method for preparing tips in situ while ensuring the crystalline structure and a reproducibly prepared tip structure up to the second atomic layer. We demonstrate a controlled evolution of such tips starting from undefined tip shapes.

  7. Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope.

    Science.gov (United States)

    Vlašínová, Helena; Neděla, Vilem; Đorđević, Biljana; Havel, Ladislav

    2017-07-01

    Somatic embryogenesis (SE) is an important biotechnological technique used for the propagation of many pine species in vitro. However, in bog pine, one of the most endangered tree species in the Czech Republic, limitations were observed, which negatively influenced the development and further germination of somatic embryos. Although initiation frequency was very low-0.95 %, all obtained cell lines were subjected to maturation. The best responding cell line (BC1) was used and subjected to six different variants of the maturation media. The media on which the highest number of early-precotyledonary/cotyledonary somatic embryos was formed was supplemented with 121 μM abscisic acid (ABA) and with 6 % maltose. In the end of maturation experiments, different abnormalities in formation of somatic embryos were observed. For visualization and identification of abnormalities in meristem development during proliferation and maturation processes, the environmental scanning electron microscope was used. In comparison to the classical light microscope, the non-commercial environmental scanning electron microscope AQUASEM II has been found as a very useful tool for the quick recognition of apical meristem disruption and abnormal development. To our knowledge, this is the first report discussing somatic embryogenesis in bog pine. Based on this observation, the cultivation procedure could be enhanced and the method for SE of bog pine optimized.

  8. Apertureless near-field scanning optical microscope working with or without laser source.

    Science.gov (United States)

    Formanek, F; De Wilde, Y; Aigouy, L; Chen, Y

    2004-01-01

    An apertureless near-field scanning optical microscope (ANSOM), used indifferent configurations, is presented. Our versatile home-made setup, based on a sharp tungsten tip glued onto a quartz tuning fork and working in tapping mode, allows to perform imaging over a broad spectral range. We have recorded optical images in the visible (wavelength, lambda = 655 nm) and in the infrared (lambda = 10.6 microm), proving that the setup routinely achieves an optical resolution of images recorded in the visible (lambda = 655 nm) in an inverted configuration where the tip does not perturb the focused spot of the illumination laser. Approach curves as well as image profiles have revealed that on demodulating the optical signal at higher harmonics, we can obtain an effective probe sharpening which results in an improvement of the resolution. Finally, we have presented optical images recorded in the infrared without any illumination, that is, the usual laser source is replaced by a simple heating of the sample. This has shown that the ANSOM can be used as a near-field thermal optical microscope (NTOM) to probe the near field generated by the thermal emission of the sample.

  9. Magnetic fingerprint of individual Fe4 molecular magnets under compression by a scanning tunnelling microscope

    Science.gov (United States)

    Burgess, Jacob A. J.; Malavolti, Luigi; Lanzilotto, Valeria; Mannini, Matteo; Yan, Shichao; Ninova, Silviya; Totti, Federico; Rolf-Pissarczyk, Steffen; Cornia, Andrea; Sessoli, Roberta; Loth, Sebastian

    2015-09-01

    Single-molecule magnets (SMMs) present a promising avenue to develop spintronic technologies. Addressing individual molecules with electrical leads in SMM-based spintronic devices remains a ubiquitous challenge: interactions with metallic electrodes can drastically modify the SMM's properties by charge transfer or through changes in the molecular structure. Here, we probe electrical transport through individual Fe4 SMMs using a scanning tunnelling microscope at 0.5 K. Correlation of topographic and spectroscopic information permits identification of the spin excitation fingerprint of intact Fe4 molecules. Building from this, we find that the exchange coupling strength within the molecule's magnetic core is significantly enhanced. First-principles calculations support the conclusion that this is the result of confinement of the molecule in the two-contact junction formed by the microscope tip and the sample surface.

  10. Resolution Enhancement of Scanning Laser Acoustic Microscope Using Transverse Wave

    International Nuclear Information System (INIS)

    Ko, D. S.; Park, J. S.; Kim, Y. H.

    1997-01-01

    We studied the resolution enhancement of a novel scanning laser acoustic microscope (SLAM) using transverse waves. Mode conversion of the ultrasonic wave takes place at the liquid-solid interface and some energy of the insonifying longitudinal waves in the water will convert to transverse wave energy within the solid specimen. The resolution of SLAM depends on the size of detecting laser spot and the wavelength of the insonifying ultrasonic waves. Science the wavelength of the transverse wave is shorter than that of the longitudinal wave, we are able to achieve the high resolution by using transverse waves. In order to operate SLAM in the transverse wave mode, we made wedge for changing the incident angle. Our experimental results with model 2140 SLAM and an aluminum specimen showed higher contrast of the SLAM image in the transverse wave mode than that in the longitudinal wave mode

  11. An ultra-high vacuum scanning tunneling microscope operating at sub-Kelvin temperatures and high magnetic fields for spin-resolved measurements

    Science.gov (United States)

    Salazar, C.; Baumann, D.; Hänke, T.; Scheffler, M.; Kühne, T.; Kaiser, M.; Voigtländer, R.; Lindackers, D.; Büchner, B.; Hess, C.

    2018-06-01

    We present the construction and performance of an ultra-low-temperature scanning tunneling microscope (STM), working in ultra-high vacuum (UHV) conditions and in high magnetic fields up to 9 T. The cryogenic environment of the STM is generated by a single-shot 3He magnet cryostat in combination with a 4He dewar system. At a base temperature (300 mK), the cryostat has an operation time of approximately 80 h. The special design of the microscope allows the transfer of the STM head from the cryostat to a UHV chamber system, where samples and STM tips can be easily exchanged. The UHV chambers are equipped with specific surface science treatment tools for the functionalization of samples and tips, including high-temperature treatments and thin film deposition. This, in particular, enables spin-resolved tunneling measurements. We present test measurements using well-known samples and tips based on superconductors and metallic materials such as LiFeAs, Nb, Fe, and W. The measurements demonstrate the outstanding performance of the STM with high spatial and energy resolution as well as the spin-resolved capability.

  12. Studies of porphyrin-containing specimens using an optical spectrometer connected to a confocal scanning laser microscope.

    Science.gov (United States)

    Trepte, O; Rokahr, I; Andersson-Engels, S; Carlsson, K

    1994-12-01

    A spectrometer has been developed for use with a confocal scanning laser microscope. With this unit, spectral information from a single point or a user-defined region within the microscope specimen can be recorded. A glass prism is used to disperse the spectral components of the recorded light over a linear CCD photodiode array with 256 elements. A regulated cooling unit keeps the detector at 277 K, thereby allowing integration times of up to 60 s. The spectral resolving power, lambda/delta lambda, ranges from 350 at lambda = 400 nm to 100 at lambda = 700 nm. Since the entrance aperture of the spectrometer has the same size as the detector pinhole used during normal confocal scanning, the three-dimensional spatial resolution is equivalent to that of normal confocal scanning. Light from the specimen is deflected to the spectrometer by a solenoid controlled mirror, allowing fast and easy switching between normal confocal scanning and spectrometer readings. With this equipment, studies of rodent liver specimens containing porphyrins have been made. The subcellular localization is of interest for the mechanisms of photodynamic therapy (PDT) of malignant tumours. Spectroscopic detection is necessary to distinguish the porphyrin signal from other fluorescent components in the specimen. Two different substances were administered to the tissue, Photofrin, a haematoporphyrin derivative (HPD) and delta-amino levulinic acid (ALA), a precursor to protoporphyrin IX and haem in the haem cycle. Both are substances under clinical trials for PDT of malignant tumours. Following administration of these compounds to the tissue, the potent photosensitizer and fluorescent compound Photofrin, or protoporphyrin IX, respectively, is accumulated.(ABSTRACT TRUNCATED AT 250 WORDS)

  13. Development of an Ultrafast Scanning Tunneling Microscope for Dynamic Surface Studies

    National Research Council Canada - National Science Library

    Nunes

    1999-01-01

    .... The microscope has demonstrated atomic resolution. We have a femtosecond laser system, optics for delivering ultrafast laser pulses to the STM, and a computer controlled delay line for time-resolved measurements...

  14. A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability

    Science.gov (United States)

    Wang, Qi; Hou, Yubin; Wang, Junting; Lu, Qingyou

    2013-11-01

    We present a novel homebuilt scanning tunneling microscope (STM) with high quality atomic resolution. It is equipped with a small but powerful GeckoDrive piezoelectric motor which drives a miniature and detachable scanning part to implement coarse approach. The scanning part is a tiny piezoelectric tube scanner (industry type: PZT-8, whose d31 coefficient is one of the lowest) housed in a slightly bigger polished sapphire tube, which is riding on and spring clamped against the knife edges of a tungsten slot. The STM so constructed shows low back-lashing and drifting and high repeatability and immunity to external vibrations. These are confirmed by its low imaging voltages, low distortions in the spiral scanned images, and high atomic resolution quality even when the STM is placed on the ground of the fifth floor without any external or internal vibration isolation devices.

  15. A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability

    International Nuclear Information System (INIS)

    Wang, Qi; Wang, Junting; Lu, Qingyou; Hou, Yubin

    2013-01-01

    We present a novel homebuilt scanning tunneling microscope (STM) with high quality atomic resolution. It is equipped with a small but powerful GeckoDrive piezoelectric motor which drives a miniature and detachable scanning part to implement coarse approach. The scanning part is a tiny piezoelectric tube scanner (industry type: PZT-8, whose d 31 coefficient is one of the lowest) housed in a slightly bigger polished sapphire tube, which is riding on and spring clamped against the knife edges of a tungsten slot. The STM so constructed shows low back-lashing and drifting and high repeatability and immunity to external vibrations. These are confirmed by its low imaging voltages, low distortions in the spiral scanned images, and high atomic resolution quality even when the STM is placed on the ground of the fifth floor without any external or internal vibration isolation devices

  16. A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability.

    Science.gov (United States)

    Wang, Qi; Hou, Yubin; Wang, Junting; Lu, Qingyou

    2013-11-01

    We present a novel homebuilt scanning tunneling microscope (STM) with high quality atomic resolution. It is equipped with a small but powerful GeckoDrive piezoelectric motor which drives a miniature and detachable scanning part to implement coarse approach. The scanning part is a tiny piezoelectric tube scanner (industry type: PZT-8, whose d31 coefficient is one of the lowest) housed in a slightly bigger polished sapphire tube, which is riding on and spring clamped against the knife edges of a tungsten slot. The STM so constructed shows low back-lashing and drifting and high repeatability and immunity to external vibrations. These are confirmed by its low imaging voltages, low distortions in the spiral scanned images, and high atomic resolution quality even when the STM is placed on the ground of the fifth floor without any external or internal vibration isolation devices.

  17. Novel low-dose imaging technique for characterizing atomic structures through scanning transmission electron microscope

    Science.gov (United States)

    Su, Chia-Ping; Syu, Wei-Jhe; Hsiao, Chien-Nan; Lai, Ping-Shan; Chen, Chien-Chun

    2017-08-01

    To investigate dislocations or heterostructures across interfaces is now of great interest to condensed matter and materials scientists. With the advances in aberration-corrected electron optics, the scanning transmission electron microscope has demonstrated its excellent capability of characterizing atomic structures within nanomaterials, and well-resolved atomic-resolution images can be obtained through long-exposure data acquisition. However, the sample drifting, carbon contamination, and radiation damage hinder further analysis, such as deriving three-dimensional (3D) structures from a series of images. In this study, a method for obtaining atomic-resolution images with significantly reduced exposure time was developed, using which an original high-resolution image with approximately one tenth the electron dose can be obtained by combining a fast-scan high-magnification image and a slow-scan low-magnification image. The feasibility of obtaining 3D atomic structures using the proposed approach was demonstrated through multislice simulation. Finally, the feasibility and accuracy of image restoration were experimentally verified. This general method cannot only apply to electron microscopy but also benefit to image radiation-sensitive materials using various light sources.

  18. The con focal laser scanning microscope: a powerful tool for the investigation of micro devices and nano structures

    International Nuclear Information System (INIS)

    Montereali, R.M.; Baldacchini, G.; Bonfigli, F.; Vincenti, M.A.; Almaviva, S.

    2008-01-01

    In the last years the Con focal Laser Scanning Microscope (CLSM), a versatile and powerful optical instrument, gained a strong increase of interest in the scientific community, not only for biological applications, but also for the characterization of materials, microstructures and devices. The conditions that favoured its wide diffusion are surely the large availability of laser sources and powerful computer-imaging and data-processing systems at relatively low cost; however, the main reason that contributed to its popularity is the ability to obtain tri dimensional reconstruction of a great variety of biological and non-biological samples with sub micrometric resolution. In this report we show the main properties and characteristics of the Con focal Microscope Nikon Eclipse 80-i C1, which has operated sinc more than two years in the Solid State Laser and Spectroscopy Laboratory of the ENEA Research Center in Frascati. Some of the results obtained in the characterization of luminescent micro and nano structures based on lithium fluoride color centers will be presented [it

  19. Scanning tunneling microscope investigation of (100) and (001) faces of YBa2Cu3O7/sub -//sub δ/

    International Nuclear Information System (INIS)

    Niedermann, P.; Scheel, H.J.; Sadowski, W.

    1989-01-01

    Thin as-grown side faces, and edge and corner regions of crystals of the tetragonal precursor phase of the high-temperature superconductor YBa 2 Cu 3 O 7 /sub -//sub δ/ were studied by scanning tunneling microscopy under scanning electron microscope control of tip positioning. From observed changes in slope of the (100) surface, in particular near the (100)/(001) edges, it was concluded that the (100) and (001) faces have different growth mechanisms

  20. Self-navigation of a scanning tunneling microscope tip toward a micron-sized graphene sample.

    Science.gov (United States)

    Li, Guohong; Luican, Adina; Andrei, Eva Y

    2011-07-01

    We demonstrate a simple capacitance-based method to quickly and efficiently locate micron-sized conductive samples, such as graphene flakes, on insulating substrates in a scanning tunneling microscope (STM). By using edge recognition, the method is designed to locate and to identify small features when the STM tip is far above the surface, allowing for crash-free search and navigation. The method can be implemented in any STM environment, even at low temperatures and in strong magnetic field, with minimal or no hardware modifications.

  1. Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips

    Directory of Open Access Journals (Sweden)

    Sumit Tewari

    2017-11-01

    Full Text Available Scanning tunneling microscopes (STM are used extensively for studying and manipulating matter at the atomic scale. In spite of the critical role of the STM tip, procedures for controlling the atomic-scale shape of STM tips have not been rigorously justified. Here, we present a method for preparing tips in situ while ensuring the crystalline structure and a reproducibly prepared tip structure up to the second atomic layer. We demonstrate a controlled evolution of such tips starting from undefined tip shapes.

  2. The Fresnel mode of Lorentz microscopy using a scanning transmission electron microscope

    International Nuclear Information System (INIS)

    Chapman, J.N.; Waddell, E.M.; Batson, P.E.; Ferrier, R.P.

    1979-01-01

    The most widely used method of investigating ferromagnetic films in the transmission electron microscope is the Fresnel or defocus mode of Lorentz microscopy. This may be implemented either in a fixed beam or a scanning instrument. Despite a rather inefficient utilization of electrons, several advantages accrue if the latter is used, and provided it is equipped with a field emission gun, low noise images may be obtained in acceptable recording times. To extract quantitative estimates of domain wall widths from such images it is necessary to measure accurately both instrumental and specimen parameters. Methods for this are discussed and an example of an analysis using a polycrystalline permalloy film is given. (Auth.)

  3. Freeze-fracture of infected plant leaves in ethanol for scanning electron microscopic study of fungal pathogens.

    Science.gov (United States)

    Moore, Jayma A; Payne, Scott A

    2012-01-01

    Fungi often are found within plant tissues where they cannot be visualized with the scanning electron microscope (SEM). We present a simple way to reveal cell interiors while avoiding many common causes of artifact. Freeze-fracture of leaf tissue using liquid nitrogen during the 100% ethanol step of the dehydration process just before critical point drying is useful in exposing intracellular fungi to the SEM.

  4. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Peng; Behan, Gavin; Kirkland, Angus I. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Nellist, Peter D., E-mail: peter.nellist@materials.ox.ac.uk [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Cosgriff, Eireann C.; D' Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J. [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Hashimoto, Ayako [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Takeguchi, Masaki [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Mitsuishi, Kazutaka [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Quantum Dot Research Center, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Shimojo, Masayuki [High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

    2011-06-15

    Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. -- Research Highlights: {yields} The confocal probe image in a scanning confocal electron microscopy image reveals information about the thickness and height of the crystalline layer. {yields} The form of the contrast in a three-dimensional bright-field scanning confocal electron microscopy image can be explained in terms of the confocal probe image. {yields} Despite the complicated form of the contrast in bright-field scanning confocal electron microscopy, we see that depth information is transferred on a 10 nm scale.

  5. Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope

    Czech Academy of Sciences Publication Activity Database

    Vlašínová, H.; Neděla, Vilém; Dordevic, B.; Havel, J.

    2017-01-01

    Roč. 254, č. 4 (2017), s. 1487-1497 ISSN 0033-183X R&D Projects: GA ČR(CZ) GA14-22777S Institutional support: RVO:68081731 Keywords : somatic embryogenesis * pinus uncinata subsp uliginosa * abnormalities * environmental scanning electron microscope Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering OBOR OECD: Plant sciences, botany Impact factor: 2.870, year: 2016

  6. Scanning electron microscope cathodoluminescence imaging of subgrain boundaries, twins and planar deformation features in quartz

    Science.gov (United States)

    Hamers, M. F.; Pennock, G. M.; Drury, M. R.

    2017-04-01

    The study of deformation features has been of great importance to determine deformation mechanisms in quartz. Relevant microstructures in both growth and deformation processes include dislocations, subgrains, subgrain boundaries, Brazil and Dauphiné twins and planar deformation features (PDFs). Dislocations and twin boundaries are most commonly imaged using a transmission electron microscope (TEM), because these cannot directly be observed using light microscopy, in contrast to PDFs. Here, we show that red-filtered cathodoluminescence imaging in a scanning electron microscope (SEM) is a useful method to visualise subgrain boundaries, Brazil and Dauphiné twin boundaries. Because standard petrographic thin sections can be studied in the SEM, the observed structures can be directly and easily correlated to light microscopy studies. In contrast to TEM preparation methods, SEM techniques are non-destructive to the area of interest on a petrographic thin section.

  7. Simultaneous measurement of static and kinetic friction of ZnO nanowires in situ with a scanning electron microscope.

    Science.gov (United States)

    Polyakov, Boris; Dorogin, Leonid M; Vlassov, Sergei; Kink, Ilmar; Romanov, Alexey E; Lohmus, Rynno

    2012-11-01

    A novel method for in situ measurement of the static and kinetic friction is developed and demonstrated for zinc oxide nanowires (NWs) on oxidised silicon wafers. The experiments are performed inside a scanning electron microscope (SEM) equipped with a nanomanipulator with an atomic force microscope tip as a probe. NWs are pushed by the tip from one end until complete displacement is achieved, while NW bending is monitored by the SEM. The elastic bending profile of a NW during the manipulation process is used to calculate the static and kinetic friction forces. Copyright © 2012 Elsevier Ltd. All rights reserved.

  8. Photon event distribution sampling: an image formation technique for scanning microscopes that permits tracking of sub-diffraction particles with high spatial and temporal resolutions.

    Science.gov (United States)

    Larkin, J D; Publicover, N G; Sutko, J L

    2011-01-01

    In photon event distribution sampling, an image formation technique for scanning microscopes, the maximum likelihood position of origin of each detected photon is acquired as a data set rather than binning photons in pixels. Subsequently, an intensity-related probability density function describing the uncertainty associated with the photon position measurement is applied to each position and individual photon intensity distributions are summed to form an image. Compared to pixel-based images, photon event distribution sampling images exhibit increased signal-to-noise and comparable spatial resolution. Photon event distribution sampling is superior to pixel-based image formation in recognizing the presence of structured (non-random) photon distributions at low photon counts and permits use of non-raster scanning patterns. A photon event distribution sampling based method for localizing single particles derived from a multi-variate normal distribution is more precise than statistical (Gaussian) fitting to pixel-based images. Using the multi-variate normal distribution method, non-raster scanning and a typical confocal microscope, localizations with 8 nm precision were achieved at 10 ms sampling rates with acquisition of ~200 photons per frame. Single nanometre precision was obtained with a greater number of photons per frame. In summary, photon event distribution sampling provides an efficient way to form images when low numbers of photons are involved and permits particle tracking with confocal point-scanning microscopes with nanometre precision deep within specimens. © 2010 The Authors Journal of Microscopy © 2010 The Royal Microscopical Society.

  9. A Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) for the Surface of Mars: An Instrument for the Planetary Science Community

    Science.gov (United States)

    Edmunson, J.; Gaskin, J. A.; Danilatos, G.; Doloboff, I. J.; Effinger, M. R.; Harvey, R. P.; Jerman, G. A.; Klein-Schoder, R.; Mackie, W.; Magera, B.; hide

    2016-01-01

    The Miniaturized Variable Pressure Scanning Electron Microscope(MVP-SEM) project, funded by the NASA Planetary Instrument Concepts for the Advancement of Solar System Observations (PICASSO) Research Opportunities in Space and Earth Science (ROSES), will build upon previous miniaturized SEM designs for lunar and International Space Station (ISS) applications and recent advancements in variable pressure SEM's to design and build a SEM to complete analyses of samples on the surface of Mars using the atmosphere as an imaging medium. By the end of the PICASSO work, a prototype of the primary proof-of-concept components (i.e., the electron gun, focusing optics and scanning system)will be assembled and preliminary testing in a Mars analog chamber at the Jet Propulsion Laboratory will be completed to partially fulfill Technology Readiness Level to 5 requirements for those components. The team plans to have Secondary Electron Imaging(SEI), Backscattered Electron (BSE) detection, and Energy Dispersive Spectroscopy (EDS) capabilities through the MVP-SEM.

  10. A compact light-sheet microscope for the study of the mammalian central nervous system

    Science.gov (United States)

    Yang, Zhengyi; Haslehurst, Peter; Scott, Suzanne; Emptage, Nigel; Dholakia, Kishan

    2016-01-01

    Investigation of the transient processes integral to neuronal function demands rapid and high-resolution imaging techniques over a large field of view, which cannot be achieved with conventional scanning microscopes. Here we describe a compact light sheet fluorescence microscope, featuring a 45° inverted geometry and an integrated photolysis laser, that is optimized for applications in neuroscience, in particular fast imaging of sub-neuronal structures in mammalian brain slices. We demonstrate the utility of this design for three-dimensional morphological reconstruction, activation of a single synapse with localized photolysis, and fast imaging of neuronal Ca2+ signalling across a large field of view. The developed system opens up a host of novel applications for the neuroscience community. PMID:27215692

  11. Interior tomography in microscopic CT with image reconstruction constrained by full field of view scan at low spatial resolution

    Science.gov (United States)

    Luo, Shouhua; Shen, Tao; Sun, Yi; Li, Jing; Li, Guang; Tang, Xiangyang

    2018-04-01

    In high resolution (microscopic) CT applications, the scan field of view should cover the entire specimen or sample to allow complete data acquisition and image reconstruction. However, truncation may occur in projection data and results in artifacts in reconstructed images. In this study, we propose a low resolution image constrained reconstruction algorithm (LRICR) for interior tomography in microscopic CT at high resolution. In general, the multi-resolution acquisition based methods can be employed to solve the data truncation problem if the project data acquired at low resolution are utilized to fill up the truncated projection data acquired at high resolution. However, most existing methods place quite strict restrictions on the data acquisition geometry, which greatly limits their utility in practice. In the proposed LRICR algorithm, full and partial data acquisition (scan) at low and high resolutions, respectively, are carried out. Using the image reconstructed from sparse projection data acquired at low resolution as the prior, a microscopic image at high resolution is reconstructed from the truncated projection data acquired at high resolution. Two synthesized digital phantoms, a raw bamboo culm and a specimen of mouse femur, were utilized to evaluate and verify performance of the proposed LRICR algorithm. Compared with the conventional TV minimization based algorithm and the multi-resolution scout-reconstruction algorithm, the proposed LRICR algorithm shows significant improvement in reduction of the artifacts caused by data truncation, providing a practical solution for high quality and reliable interior tomography in microscopic CT applications. The proposed LRICR algorithm outperforms the multi-resolution scout-reconstruction method and the TV minimization based reconstruction for interior tomography in microscopic CT.

  12. Investigation into scanning tunnelling luminescence microscopy

    International Nuclear Information System (INIS)

    Manson-Smith, S.K.

    2001-01-01

    This work reports on the development of a scanning tunnelling luminescence (STL) microscope and its application to the study of Ill-nitride semiconductor materials used in the production of light emitting devices. STL microscopy is a technique which uses the high resolution topographic imaging capabilities of the scanning tunnelling microscope (STM) to generate high resolution luminescence images. The STM tunnelling current acts as a highly localised source of electrons (or holes) which generates luminescence in certain materials. Light generated at the STM tunnelling junction is collected concurrently with the height variation of the tunnelling probe as it is scanned across a sample surface, producing simultaneous topographic and luminescence images. Due to the very localised excitation source, high resolution luminescence images can be obtained. Spectroscopic resolution can be obtained by using filters. Additionally, the variation of luminescence intensity with tunnel current and with bias voltage can provide information on recombination processes and material properties. The design and construction of a scanning tunnelling luminescence microscope is described in detail. Operating under ambient conditions, the microscope has several novel features, including a new type of miniature inertial slider-based approach motor, large solid-angle light collection optical arrangement and a tip-height regulation system which requires the minimum of operator input. (author)

  13. Thimble microscope system

    Science.gov (United States)

    Kamal, Tahseen; Rubinstein, Jaden; Watkins, Rachel; Cen, Zijian; Kong, Gary; Lee, W. M.

    2016-12-01

    Wearable computing devices, e.g. Google Glass, Smart watch, embodies the new human design frontier, where technology interfaces seamlessly with human gestures. During examination of any subject in the field (clinic, surgery, agriculture, field survey, water collection), our sensory peripherals (touch and vision) often go hand-in-hand. The sensitivity and maneuverability of the human fingers are guided with tight distribution of biological nerve cells, which perform fine motor manipulation over a range of complex surfaces that is often out of sight. Our sight (or naked vision), on the other hand, is generally restricted to line of sight that is ill-suited to view around corner. Hence, conventional imaging methods are often resort to complex light guide designs (periscope, endoscopes etc) to navigate over obstructed surfaces. Using modular design strategies, we constructed a prototype miniature microscope system that is incorporated onto a wearable fixture (thimble). This unique platform allows users to maneuver around a sample and take high resolution microscopic images. In this paper, we provide an exposition of methods to achieve a thimble microscopy; microscope lens fabrication, thimble design, integration of miniature camera and liquid crystal display.

  14. Multifractal spectra of scanning electron microscope images of SnO2 thin films prepared by pulsed laser deposition

    International Nuclear Information System (INIS)

    Chen, Z.W.; Lai, J.K.L.; Shek, C.H.

    2005-01-01

    The concept of fractal geometry has proved useful in describing structures and processes in experimental systems. In this Letter, the surface topographies of SnO 2 thin films prepared by pulsed laser deposition for various substrate temperatures were measured by scanning electron microscope (SEM). Multifractal spectra f(α) show that the higher the substrate temperature, the wider the spectrum, and the larger the Δf(Δf=f(α min )-f(α max )). It is apparent that the nonuniformity of the height distribution increases with the increasing substrate temperature, and the liquid droplets of SnO 2 thin films are formed on previous thin films. These results show that the SEM images can be characterized by the multifractal spectra

  15. A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K.

    Science.gov (United States)

    Lange, M; Guénon, S; Lever, F; Kleiner, R; Koelle, D

    2017-12-01

    Polarized light microscopy, as a contrast-enhancing technique for optically anisotropic materials, is a method well suited for the investigation of a wide variety of effects in solid-state physics, as, for example, birefringence in crystals or the magneto-optical Kerr effect (MOKE). We present a microscopy setup that combines a widefield microscope and a confocal scanning laser microscope with polarization-sensitive detectors. By using a high numerical aperture objective, a spatial resolution of about 240 nm at a wavelength of 405 nm is achieved. The sample is mounted on a 4 He continuous flow cryostat providing a temperature range between 4 K and 300 K, and electromagnets are used to apply magnetic fields of up to 800 mT with variable in-plane orientation and 20 mT with out-of-plane orientation. Typical applications of the polarizing microscope are the imaging of the in-plane and out-of-plane magnetization via the longitudinal and polar MOKE, imaging of magnetic flux structures in superconductors covered with a magneto-optical indicator film via the Faraday effect, or imaging of structural features, such as twin-walls in tetragonal SrTiO 3 . The scanning laser microscope furthermore offers the possibility to gain local information on electric transport properties of a sample by detecting the beam-induced voltage change across a current-biased sample. This combination of magnetic, structural, and electric imaging capabilities makes the microscope a viable tool for research in the fields of oxide electronics, spintronics, magnetism, and superconductivity.

  16. A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K

    Science.gov (United States)

    Lange, M.; Guénon, S.; Lever, F.; Kleiner, R.; Koelle, D.

    2017-12-01

    Polarized light microscopy, as a contrast-enhancing technique for optically anisotropic materials, is a method well suited for the investigation of a wide variety of effects in solid-state physics, as, for example, birefringence in crystals or the magneto-optical Kerr effect (MOKE). We present a microscopy setup that combines a widefield microscope and a confocal scanning laser microscope with polarization-sensitive detectors. By using a high numerical aperture objective, a spatial resolution of about 240 nm at a wavelength of 405 nm is achieved. The sample is mounted on a 4He continuous flow cryostat providing a temperature range between 4 K and 300 K, and electromagnets are used to apply magnetic fields of up to 800 mT with variable in-plane orientation and 20 mT with out-of-plane orientation. Typical applications of the polarizing microscope are the imaging of the in-plane and out-of-plane magnetization via the longitudinal and polar MOKE, imaging of magnetic flux structures in superconductors covered with a magneto-optical indicator film via the Faraday effect, or imaging of structural features, such as twin-walls in tetragonal SrTiO3. The scanning laser microscope furthermore offers the possibility to gain local information on electric transport properties of a sample by detecting the beam-induced voltage change across a current-biased sample. This combination of magnetic, structural, and electric imaging capabilities makes the microscope a viable tool for research in the fields of oxide electronics, spintronics, magnetism, and superconductivity.

  17. SEM analysis of ionizing radiation effects in linear integrated circuits. [Scanning Electron Microscope

    Science.gov (United States)

    Stanley, A. G.; Gauthier, M. K.

    1977-01-01

    A successful diagnostic technique was developed using a scanning electron microscope (SEM) as a precision tool to determine ionization effects in integrated circuits. Previous SEM methods radiated the entire semiconductor chip or major areas. The large area exposure methods do not reveal the exact components which are sensitive to radiation. To locate these sensitive components a new method was developed, which consisted in successively irradiating selected components on the device chip with equal doses of electrons /10 to the 6th rad (Si)/, while the whole device was subjected to representative bias conditions. A suitable device parameter was measured in situ after each successive irradiation with the beam off.

  18. Development of a scanning tunneling microscope combined with a synchrotron radiation light source

    International Nuclear Information System (INIS)

    Hasegawa, Yukio; Okuda, Taichi; Eguchi, Toyoaki; Matsushima, Takeshi; Harasawa, Ayumi; Akiyama, Kotone; Kinoshita, Toyohiko

    2005-01-01

    We have developed a scanning tunneling microscope (STM) combined with a synchrotron-radiation light source (SR-STM) aiming at elemental analysis in a spatial resolution of STM. Using SR-STM atomically resolved STM images under the irradiation and also X-ray adsorption spectra clearly showing an adsorption edge of a substrate were successfully obtained by detecting photo-emitted electrons with the STM tip. In order to focus the probing area of the photo-induced current, a glass-coated metal tip sharpened with focused ion beam was used as a probe. The present situation and prospects of the instrument are discussed in this review. (author)

  19. Traceable X,Y self-calibration at single nm level of an optical microscope used for coherence scanning interferometry

    Science.gov (United States)

    Ekberg, Peter; Mattsson, Lars

    2018-03-01

    Coherence scanning interferometry used in optical profilers are typically good for Z-calibration at nm-levels, but the X,Y accuracy is often left without further notice than typical resolution limits of the optics, i.e. of the order of ~1 µm. For the calibration of metrology tools we rely on traceable artefacts, e.g. gauge blocks for traditional coordinate measurement machines, and lithographically mask made artefacts for microscope calibrations. In situations where the repeatability and accuracy of the measurement tool is much better than the uncertainty of the traceable artefact, we are bound to specify the uncertainty based on the calibration artefact rather than on the measurement tool. This is a big drawback as the specified uncertainty of a calibrated measurement may shrink the available manufacturing tolerance. To improve the uncertainty in X,Y we can use self-calibration. Then, we do not need to know anything more than that the artefact contains a pattern with some nominal grid. This also gives the opportunity to manufacture the artefact in-house, rather than buying a calibrated and expensive artefact. The self-calibration approach we present here is based on an iteration algorithm, rather than the traditional mathematical inversion, and it leads to much more relaxed constrains on the input measurements. In this paper we show how the X,Y errors, primarily optical distortions, within the field of view (FOV) of an optical coherence scanning interferometry microscope, can be reduced with a large factor. By self-calibration we achieve an X,Y consistency in the 175  ×  175 µm2 FOV of ~2.3 nm (1σ) using the 50×  objective. Besides the calibrated coordinate X,Y system of the microscope we also receive, as a bonus, the absolute positions of the pattern in the artefact with a combined uncertainty of 6 nm (1σ) by relying on a traceable 1D linear measurement of a twin artefact at NIST.

  20. Note: long range and accurate measurement of deep trench microstructures by a specialized scanning tunneling microscope.

    Science.gov (United States)

    Ju, Bing-Feng; Chen, Yuan-Liu; Zhang, Wei; Zhu, Wule; Jin, Chao; Fang, F Z

    2012-05-01

    A compact but practical scanning tunneling microscope (STM) with high aspect ratio and high depth capability has been specially developed. Long range scanning mechanism with tilt-adjustment stage is adopted for the purpose of adjusting the probe-sample relative angle to compensate the non-parallel effects. A periodical trench microstructure with a pitch of 10 μm has been successfully imaged with a long scanning range up to 2.0 mm. More innovatively, a deep trench with depth and step height of 23.0 μm has also been successfully measured, and slope angle of the sidewall can approximately achieve 67°. The probe can continuously climb the high step and exploring the trench bottom without tip crashing. The new STM could perform long range measurement for the deep trench and high step surfaces without image distortion. It enables accurate measurement and quality control of periodical trench microstructures.

  1. High vacuum tip-enhanced Raman spectroscope based on a scanning tunneling microscope.

    Science.gov (United States)

    Fang, Yurui; Zhang, Zhenglong; Sun, Mengtao

    2016-03-01

    In this paper, we present the construction of a high-vacuum tip-enhanced Raman spectroscopy (HV-TERS) system that allows in situ sample preparation and measurement. A detailed description of the prototype instrument is presented with experimental validation of its use and novel ex situ experimental results using the HV-TERS system. The HV-TERS system includes three chambers held under a 10(-7) Pa vacuum. The three chambers are an analysis chamber, a sample preparation chamber, and a fast loading chamber. The analysis chamber is the core chamber and contains a scanning tunneling microscope (STM) and a Raman detector coupled with a 50 × 0.5 numerical aperture objective. The sample preparation chamber is used to produce single-crystalline metal and sub-monolayer molecular films by molecular beam epitaxy. The fast loading chamber allows ex situ preparation of samples for HV-TERS analysis. Atomic resolution can be achieved by the STM on highly ordered pyrolytic graphite. We demonstrate the measurement of localized temperature using the Stokes and anti-Stokes TERS signals from a monolayer of 1,2-benzenedithiol on a gold film using a gold tip. Additionally, plasmonic catalysis can be monitored label-free at the nanoscale using our device. Moreover, the HV-TERS experiments show simultaneously activated infrared and Raman vibrational modes, Fermi resonance, and some other non-linear effects that are not observed in atmospheric TERS experiments. The high spatial and spectral resolution and pure environment of high vacuum are beneficial for basic surface studies.

  2. High vacuum tip-enhanced Raman spectroscope based on a scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Fang, Yurui [Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-146, Beijing 100190 (China); Bionanophotonics, Department of Applied Physics, Chalmers University of Technology, Göteborg, SE 41296 (Sweden); Zhang, Zhenglong [Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-146, Beijing 100190 (China); School of Physics and Information Technology, Shaanxi Normal University, 710062 Xi’an (China); Leibniz Institute of Photonic Technology, Albert-Einstein-Str. 9, 07745 Jena (Germany); Sun, Mengtao, E-mail: mtsun@iphy.ac.cn [Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-146, Beijing 100190 (China)

    2016-03-15

    In this paper, we present the construction of a high-vacuum tip-enhanced Raman spectroscopy (HV-TERS) system that allows in situ sample preparation and measurement. A detailed description of the prototype instrument is presented with experimental validation of its use and novel ex situ experimental results using the HV-TERS system. The HV-TERS system includes three chambers held under a 10{sup −7} Pa vacuum. The three chambers are an analysis chamber, a sample preparation chamber, and a fast loading chamber. The analysis chamber is the core chamber and contains a scanning tunneling microscope (STM) and a Raman detector coupled with a 50 × 0.5 numerical aperture objective. The sample preparation chamber is used to produce single-crystalline metal and sub-monolayer molecular films by molecular beam epitaxy. The fast loading chamber allows ex situ preparation of samples for HV-TERS analysis. Atomic resolution can be achieved by the STM on highly ordered pyrolytic graphite. We demonstrate the measurement of localized temperature using the Stokes and anti-Stokes TERS signals from a monolayer of 1,2-benzenedithiol on a gold film using a gold tip. Additionally, plasmonic catalysis can be monitored label-free at the nanoscale using our device. Moreover, the HV-TERS experiments show simultaneously activated infrared and Raman vibrational modes, Fermi resonance, and some other non-linear effects that are not observed in atmospheric TERS experiments. The high spatial and spectral resolution and pure environment of high vacuum are beneficial for basic surface studies.

  3. [Remote Slit Lamp Microscope Consultation System Based on Web].

    Science.gov (United States)

    Chen, Junfa; Zhuo, Yong; Liu, Zuguo; Chen, Yanping

    2015-11-01

    To realize the remote operation of the slit lamp microscope for department of ophthalmology consultation, and visual display the real-time status of remote slit lamp microscope, a remote slit lamp microscope consultation system based on B/S structure is designed and implemented. Through framing the slit lamp microscope on the website system, the realtime acquisition and transmission of remote control and image data is realized. The three dimensional model of the slit lamp microscope is established and rendered on the web by using WebGL technology. The practical application results can well show the real-time interactive of the remote consultation system.

  4. Photon emission spectroscopy of NiAl(110) in the scanning tunneling microscope

    International Nuclear Information System (INIS)

    Nilius, N.; Ernst, N.; Freund, H.-J.; Johansson, P.

    2000-01-01

    Spectroscopic measurements have been carried out of the light emitted from the NiAl(110)/W tunnel junction of a scanning tunneling microscope. The data reveal two prominent emission lines in the visible and near-infrared region. Corresponding model calculations assign the observed light emission to the radiating decay of the tip-induced plasmon excited in the tip-sample cavity. In agreement with the theory, a low- and a high-energy mode of the plasmon can be distinguished in the experimental data. Since the excitation probability of the two modes is determined by the size of the tunnel cavity, it can be influenced by the radius of the tunnel tip. A blunted tip favors the observation conditions of the higher mode

  5. Cancer cell imaging by stable wet near-field scanning optical microscope with resonance tracking method

    International Nuclear Information System (INIS)

    Park, Kyoung-Duck; Park, Doo-Jae; Jeong, Mun-Seok; Choi, Geun-Chang; Lee, Seung-Gol; Byeon, Clare-Chisu; Choi, Soo-Bong

    2014-01-01

    We report on a successful topographical and optical imaging of various cancer cells in liquid and in air by using a stable wet near-field scanning optical microscope that utilizes a resonance tracking method. We observed a clear dehydration which gives rise to a decrease in the cell volume down to 51%. In addition, a micro-ball lens effect due to the round-shaped young cancer cells was observed from near-field imaging, where the refractive index of young cancer cells was deduced.

  6. Cancer cell imaging by stable wet near-field scanning optical microscope with resonance tracking method

    Energy Technology Data Exchange (ETDEWEB)

    Park, Kyoung-Duck [Sungkyunkwan University, Suwon (Korea, Republic of); Inha University, Incheon (Korea, Republic of); Park, Doo-Jae; Jeong, Mun-Seok [Sungkyunkwan University, Suwon (Korea, Republic of); Choi, Geun-Chang [Seoul National University, Seoul (Korea, Republic of); Lee, Seung-Gol [Inha University, Incheon (Korea, Republic of); Byeon, Clare-Chisu [Kyungpook National University, Daegu (Korea, Republic of); Choi, Soo-Bong [Incheon National University, Incheon (Korea, Republic of)

    2014-05-15

    We report on a successful topographical and optical imaging of various cancer cells in liquid and in air by using a stable wet near-field scanning optical microscope that utilizes a resonance tracking method. We observed a clear dehydration which gives rise to a decrease in the cell volume down to 51%. In addition, a micro-ball lens effect due to the round-shaped young cancer cells was observed from near-field imaging, where the refractive index of young cancer cells was deduced.

  7. Distance control for a near-field scanning microwave microscope in liquid using a quartz tuning fork

    International Nuclear Information System (INIS)

    Kim, Song Hul; Yoo, Hyun Jun; Yoo, Hyung Geun; Lee, Kie Jin

    2004-01-01

    We demonstrate a scanning near-field microwave microscope (NSMM) in the liquid environment using a tuning fork shear-force feedback method to control the distance between tip and sample. The probe tip for the NSMM is only immersed in water and attached to one prong of a quartz tuning fork and directly coupled to a high-quality dielectric resonator at an operating frequency f = 4.5-5.5 GHz. This distance control method is independent of the local microwave characteristics. The amplitude of the tuning fork was used as a set point of the distance control parameter in the liquid. To demonstrate the ability of the distance regulation system, we present the NSMM images of a copper film in air and liquid without and with readjusting the distance set point and a DNA film image in buffer solution.

  8. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope

    Energy Technology Data Exchange (ETDEWEB)

    Imtiaz, Atif [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Electrical, Computer, and Energy Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Wallis, Thomas M.; Brubaker, Matt D.; Blanchard, Paul T.; Bertness, Kris A.; Sanford, Norman A.; Kabos, Pavel, E-mail: kabos@boulder.nist.gov [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Weber, Joel C. [Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States); Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309 (United States); Coakley, Kevin J. [Information Technology Laboratory, National Institute of Standards and Technology, Boulder, Colorado 80305 (United States)

    2014-06-30

    We used a broadband, atomic-force-microscope-based, scanning microwave microscope (SMM) to probe the axial dependence of the charge depletion in a p-n junction within a gallium nitride nanowire (NW). SMM enables the visualization of the p-n junction location without the need to make patterned electrical contacts to the NW. Spatially resolved measurements of S{sub 11}{sup ′}, which is the derivative of the RF reflection coefficient S{sub 11} with respect to voltage, varied strongly when probing axially along the NW and across the p-n junction. The axial variation in S{sub 11}{sup ′}  effectively mapped the asymmetric depletion arising from the doping concentrations on either side of the junction. Furthermore, variation of the probe tip voltage altered the apparent extent of features associated with the p-n junction in S{sub 11}{sup ′} images.

  9. Scanning Electron Microscope Mapping System Developed for Detecting Surface Defects in Fatigue Specimens

    Science.gov (United States)

    Bonacuse, Peter J.; Kantzos, Peter T.

    2002-01-01

    An automated two-degree-of-freedom specimen positioning stage has been developed at the NASA Glenn Research Center to map and monitor defects in fatigue specimens. This system expedites the examination of the entire gauge section of fatigue specimens so that defects can be found using scanning electron microscopy (SEM). Translation and rotation stages are driven by microprocessor-based controllers that are, in turn, interfaced to a computer running custom-designed software. This system is currently being used to find and record the location of ceramic inclusions in powder metallurgy materials. The mapped inclusions are periodically examined during interrupted fatigue experiments. The number of cycles to initiate cracks from these inclusions and the rate of growth of initiated cracks can then be quantified. This information is necessary to quantify the effect of this type of defect on the durability of powder metallurgy materials. This system was developed with support of the Ultra Safe program.

  10. Analysis of light scattering from human breast tissue using a custom dual-optical scanning near-field optical microscope.

    Science.gov (United States)

    Kyle, Jennifer Reiber; Kyle, Michael D; Raghavan, Ravi; Budak, Gurer; Ozkan, Cengiz S; Ozkan, Mihrimah

    2011-03-01

    In this paper we introduce a custom scanning near-field optical microscope (SNOM) that simultaneously collects reflection and transmission near-field images along with topography. This dual-optical SNOM uses a bent probe, which allows for axial reflection imaging, accurate surface scanning, and easy identification of topographic artifacts. Using this novel dual-optical SNOM, we image desiccated and non-desiccated human breast epithelial tissue. By comparing the simultaneous SNOM images, we isolate the effects of tissue morphology and variations in refractive indices on the forward- and back-scattering of light from the tissue. We find that the reduction in back-scattering from tissue, relative to the glass slide, is caused by dense packing of the scattering sites in the cytoplasm (morphology) in the desiccated tissue and a thin-film of water adhering to the glass slide (refractive index) in the non-desiccated tissue sample. Our work demonstrates the potential of our customized dual-optical SNOM system for label-free tissue diagnostics. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  11. Sparse sampling and reconstruction for electron and scanning probe microscope imaging

    Science.gov (United States)

    Anderson, Hyrum; Helms, Jovana; Wheeler, Jason W.; Larson, Kurt W.; Rohrer, Brandon R.

    2015-07-28

    Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

  12. Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems.

    Science.gov (United States)

    Zhang, Xinming; Cen, Xi; Ravichandran, Rijuta; Hughes, Lauren A; van Benthem, Klaus

    2016-06-01

    The scanning electron microscope provides a platform for subnanometer resolution characterization of material morphology with excellent topographic and chemical contrast dependent on the used detectors. For imaging applications, the predominantly utilized signals are secondary electrons (SEs) and backscattered electrons (BSEs) that are emitted from the sample surface. Recent advances in detector technology beyond the traditional Everhart-Thornley geometry have enabled the simultaneous acquisition and discrimination of SE and BSE signals. This study demonstrates the imaging capabilities of a recently introduced new detector system that consists of the combination of two in-lens (I-L) detectors and one in-column (I-C) detector. Coupled with biasing the sample stage to reduce electron-specimen interaction volumes, this trinity of detector geometry allows simultaneous acquisition of signals to distinguish chemical contrast from topographical changes of the sample, including the identification of surface contamination. The I-C detector provides 4× improved topography, whereas the I-L detector closest to the sample offers excellent simultaneous chemical contrast imaging while not limiting the minimization of working distance to obtain optimal lateral resolution. Imaging capabilities and contrast mechanisms for all three detectors are discussed quantitatively in direct comparison to each other and the conventional Everhart-Thornley detector.

  13. Contrast and decay of cathodoluminescence from phosphor particles in a scanning electron microscope.

    Science.gov (United States)

    den Engelsen, Daniel; Harris, Paul G; Ireland, Terry G; Fern, George R; Silver, Jack

    2015-10-01

    Cathodoluminescence (CL) studies are reported on phosphors in a field emission scanning electron microscope (FESEM). ZnO: Zn and other luminescent powders manifest a bright ring around the periphery of the particles: this ring enhances the contrast. Additionally, particles resting on top of others are substantially brighter than underlying ones. These phenomena are explained in terms of the combined effects of electrons backscattered out of the particles, together with light absorption by the substrate. The contrast is found to be a function of the particle size and the energy of the primary electrons. Some phosphor materials exhibit a pronounced comet-like structure at high scan rates in a CL-image, because the particle continues to emit light after the electron beam has moved to a position without phosphor material. Image analysis has been used to study the loss of brightness along the tail and hence to determine the decay time of the materials. The effect of phosphor saturation on the determination of decay times by CL-microscopy was also investigated. Copyright © 2015 Elsevier B.V. All rights reserved.

  14. Demonstrating the utility of boron based precursor molecules for selective area deposition in a scanning tunneling microscope

    International Nuclear Information System (INIS)

    Perkins, F.K.; Onellion, M.; Lee, S.; Bowben, T.A.

    1992-01-01

    The scanning tunneling microscope (STM) can be used to selectively deposit material from a gaseous precursor compound. Ultrasmall (less than a 100 nm across) spatial dimensions for selective area deposition may be achieved by this means. In this paper the authors outline a scheme foreselecting and designing main group cluster compounds and organometallics for this type of selective area deposition using nido-decaborane(14) as an example

  15. In-situ measurement of bending strength of TiC whiskers in the scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Seino, Yutaka; Shin, Shoichiro; Nagai, Satoshi [National Research Lab. of Metrology, Tsukuba, Ibaraki (Japan)

    1995-10-01

    The three-point bending strength of TiC whiskers was measured in a scanning electron microscope. The whisker samples have {approximately} 50 {micro}m length and 2 {approximately} 4 {micro}m diameter and are commercially available as reinforcements. For composite materials. The distribution of the bending strengths of the whiskers showed a double peak around 5.2GPa and 30.4GPa, respectively. The difference in these values is attributed to differences in the cleavage strength of two crystal planes depending on whisker growth direction.

  16. Study of mechanically stimulated ferroelectric domain formation using scanning probe microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kim, J H; Baek, J; Khim, Z G [School of Physics and Nano-Systems Institute, Seoul National University, Seoul 151-747 (Korea, Republic of)

    2007-03-15

    The stress-related ferroelectric properties have been studied on the Triglycine sulfate (TGS) by scanning probe microscope (SPM). Together with normal stress of the tip, the lateral stress is applied to the sample with piezoelectric transducers. With this study, we characterized the way the ferroelectricity of TGS responds to the axis-specific stress. Specially, the b-directional stress applicable to the surface can amount to several GPa such that the polarization switching by mechanical stress is observable. Although the lateral stress is not strong enough to view such phenomena, a-axis(c-axis) stress still affects the polarization value so as to fortify (lessen) the electric field inside, respectively. These contrasting results can be explained by the sign relation of piezo-coefficients about the individual axis. This work can be a touchstone of future researches in characterizing the electromechanical properties of more popular ferroelectrics such as PZT or BTO.

  17. Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1998-01-01

    We demonstrate: the use of an ultrafast scanning tunneling microscope on a semiconductor surface. Laser-induced transient signals with 1.8 ps rise time are detected, The investigated sample is a low-temperature grown GaAs layer plated on a sapphire substrate with a thin gold layer that serves as st...... bias contact, For comparison, the measurements are performed with the tip in contact to the sample as well as in tunneling above the surface, In contact and under bias, the transient signals are identified as a transient photocurrent, An additional signal is generated by a transient voltage induced...... by the nonuniform carrier density created by the absorption of the light (photo Dember effect). The transient depends in sign and in shape on the direction of optical excitation. This signal is the dominating transient in tunneling mode. The signals are explained by a capacitive coupling across the tunneling gap...

  18. Remote control scanning electron microscope with Web operation

    International Nuclear Information System (INIS)

    Yamada, A.; Hirahara, O.; Date, M.; Lozbin, V.; Tsuchida, T.; Sugano, N.

    2002-01-01

    Full text: Recently, SEM (Scanning Electron Microscope) and the other observation instruments are coming to use a LAN (Local Area Network) to save the image in the database. We developed a remote control system in which SEM image and Control interface is indicated on the WEB Browser. In this system, SEM can be controlled by an external (client) PC installed in a general WEB Browser (Internet Explorer). Accordingly, operation interface can be indicated on the WEB browser. A JSM-6700F is connected to a LAN, and so a client PC can control the microscope. The JSM-6700F has two lines to the LAN for image transfer and communication with the SEM control. In order to transfer the image, the image size squeezes from 1280 x 1024-pixels (SEM image size) to 640x480-pixels for quick transfer. The image signal (640 x 480-pixels) is connected to the video server only, and then the image transfers to the client PC via LAN. The SEM control communicates with client PC for external command. On the other hand, the SEM control interface and the image are indicated on WEB Browser (Internet explorer). The SEM control interface is composed of the SEM image area and the SEM control part. The SEM image indicates the 640x480-pixels live image. This live image is being used as a high resolution live image transfer in the image transfer technology which a network is used for at present. If it is LAN beyond 10 base, this indication of an image can be transferred fully. When it is connected in the small line of the capacity, the refresh speed of the image becomes slow because of image data doesn't finish transferring it. In such a case, image size can be changed smaller by the LAN conditions. When a high quality image is necessary, the image of 1280 x 1024-pixels is saved on a SEM (server) side by choosing the image save button. At the same time, the file kept in SEM (server) is transferred to the client PC automatically, so that we can display a high quality image on the client PC side. The

  19. First test model of the optical microscope which images the whole vertical particle tracks without any depth scanning

    International Nuclear Information System (INIS)

    Soroko, L.M.

    2001-01-01

    The first test model of the optical microscope which produces the in focus image of the whole vertical particle track without depth scanning is described. The in focus image of the object consisting of the linear array of the point-like elements was obtained. A comparison with primary out of focus image of such an object has been made

  20. A high-resolution multimode digital microscope system.

    Science.gov (United States)

    Salmon, Edward D; Shaw, Sidney L; Waters, Jennifer C; Waterman-Storer, Clare M; Maddox, Paul S; Yeh, Elaine; Bloom, Kerry

    2013-01-01

    This chapter describes the development of a high-resolution, multimode digital imaging system based on a wide-field epifluorescent and transmitted light microscope, and a cooled charge-coupled device (CCD) camera. The three main parts of this imaging system are Nikon FXA microscope, Hamamatsu C4880 cooled CCD camera, and MetaMorph digital imaging system. This chapter presents various design criteria for the instrument and describes the major features of the microscope components-the cooled CCD camera and the MetaMorph digital imaging system. The Nikon FXA upright microscope can produce high resolution images for both epifluorescent and transmitted light illumination without switching the objective or moving the specimen. The functional aspects of the microscope set-up can be considered in terms of the imaging optics, the epi-illumination optics, the transillumination optics, the focus control, and the vibration isolation table. This instrument is somewhat specialized for microtubule and mitosis studies, and it is also applicable to a variety of problems in cellular imaging, including tracking proteins fused to the green fluorescent protein in live cells. The instrument is also valuable for correlating the assembly dynamics of individual cytoplasmic microtubules (labeled by conjugating X-rhodamine to tubulin) with the dynamics of membranes of the endoplasmic reticulum (labeled with DiOC6) and the dynamics of the cell cortex (by differential interference contrast) in migrating vertebrate epithelial cells. This imaging system also plays an important role in the analysis of mitotic mutants in the powerful yeast genetic system Saccharomyces cerevisiae. Copyright © 1998 Elsevier Inc. All rights reserved.

  1. Reconstructing 3D profiles of flux distribution in array of unshunted Josephson junctions from 2D scanning SQUID microscope images

    International Nuclear Information System (INIS)

    Nascimento, F.M.; Sergeenkov, S.; Araujo-Moreira, F.M.

    2012-01-01

    By using a specially designed algorithm (based on utilizing the so-called Hierarchical Data Format), we report on successful reconstruction of 3D profiles of local flux distribution within artificially prepared arrays of unshunted Nb-AlO x -Nb Josephson junctions from 2D surface images obtained via the scanning SQUID microscope. The analysis of the obtained results suggest that for large sweep areas, the local flux distribution significantly deviates from the conventional picture and exhibits a more complicated avalanche-type behavior with a prominent dendritic structure. -- Highlights: ► The penetration of external magnetic field into an array of Nb-AlO x -Nb Josephson junctions is studied. ► Using Scanning SQUID Microscope, 2D images of local flux distribution within array are obtained. ► Using specially designed pattern recognition algorithm, 3D flux profiles are reconstructed from 2D images.

  2. Analytical model of the optical vortex microscope.

    Science.gov (United States)

    Płocinniczak, Łukasz; Popiołek-Masajada, Agnieszka; Masajada, Jan; Szatkowski, Mateusz

    2016-04-20

    This paper presents an analytical model of the optical vortex scanning microscope. In this microscope the Gaussian beam with an embedded optical vortex is focused into the sample plane. Additionally, the optical vortex can be moved inside the beam, which allows fine scanning of the sample. We provide an analytical solution of the whole path of the beam in the system (within paraxial approximation)-from the vortex lens to the observation plane situated on the CCD camera. The calculations are performed step by step from one optical element to the next. We show that at each step, the expression for light complex amplitude has the same form with only four coefficients modified. We also derive a simple expression for the vortex trajectory of small vortex displacements.

  3. Re-scan confocal microscopy: scanning twice for better resolution.

    Science.gov (United States)

    De Luca, Giulia M R; Breedijk, Ronald M P; Brandt, Rick A J; Zeelenberg, Christiaan H C; de Jong, Babette E; Timmermans, Wendy; Azar, Leila Nahidi; Hoebe, Ron A; Stallinga, Sjoerd; Manders, Erik M M

    2013-01-01

    We present a new super-resolution technique, Re-scan Confocal Microscopy (RCM), based on standard confocal microscopy extended with an optical (re-scanning) unit that projects the image directly on a CCD-camera. This new microscope has improved lateral resolution and strongly improved sensitivity while maintaining the sectioning capability of a standard confocal microscope. This simple technology is typically useful for biological applications where the combination high-resolution and high-sensitivity is required.

  4. Density-matrix approach for the electroluminescence of molecules in a scanning tunneling microscope.

    Science.gov (United States)

    Tian, Guangjun; Liu, Ji-Cai; Luo, Yi

    2011-04-29

    The electroluminescence (EL) of molecules confined inside a nanocavity in the scanning tunneling microscope possesses many intriguing but unexplained features. We present here a general theoretical approach based on the density-matrix formalism to describe the EL from molecules near a metal surface induced by both electron tunneling and localized surface plasmon excitations simultaneously. It reveals the underlying physical mechanism for the external bias dependent EL. The important role played by the localized surface plasmon on the EL is highlighted. Calculations for porphyrin derivatives have reproduced corresponding experimental spectra and nicely explained the observed unusual large variation of emission spectral profiles. This general theoretical approach can find many applications in the design of molecular electronic and photonic devices.

  5. IN-SITU EXPERIMENTS OF VACUUM DISCHARGE USING SCANNING ELECTRON MICROSCOPES

    CERN Document Server

    Muranaka, T; Leifer, K; Ziemann, V

    2011-01-01

    The fundamental understanding of vacuum discharge mechanisms and induced surface damage is indispensable for the CLIC feasibility study. We have been conducting dc sparc experiments inside a Scanning Electron Microscope (SEM) at Uppsala university in order to investigate localized breakdown phenomena. By using a SEM, we achieve the resolution of the electron probe in the few-nm range, which is of great advantage as the surface roughness of the polished accelerating structures is in the same scale. The high accelerating field of 1 GV/m is realized by biasing an electrode with 1 kV set above the sample with a gap of sub μm. Furthermore, a second SEM equipped with a Focused Ion Beam (FIB) is used to modify the topography of sample surfaces thus the geometrical dependence of field emissions and vacuum discharges can be studied. The FIB can be used for the surface damage analysis as well. We have demonstrated subsurface damage observations by using FIB to sputter a rectangular recess into the sample in the breakd...

  6. Studies of superconductors using a low-temperature, high-field scanning tunneling microscope

    International Nuclear Information System (INIS)

    Kirtley, J.R.; Feenstra, R.M.; Fein, A.P.

    1988-01-01

    We have developed a scanning tunneling microscope (STM) capable of operating at temperatures as low as 0.4 K and fields as high as 8 T. We have used this STM to study the energy gap of the high-T/sub c/ superconductors La--Sr--Cu--O and Y--Ba--Cu--O. We find that the reduced gap for these oxide superconductors falls in the range 3<2Δ/k/sub B/T/sub c/<7, for polycrystalline, single-crystal, and thin-film samples. We have also simultaneously imaged the surface topography and superconducting energy gap for thin films of the granular superconductor NbN. We occasionally see regions with smaller best-fit gaps that correlate with surface topographical features, but have been unable so far to image flux vortices

  7. Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage.

    Science.gov (United States)

    Kim, J-J; Joo, S H; Lee, K S; Yoo, J H; Park, M S; Kwak, J S; Lee, Jinho

    2017-04-01

    The Low Temperature Scanning Tunneling Microscope (LT-STM) is an extremely valuable tool not only in surface science but also in condensed matter physics. For years, numerous new ideas have been adopted to perfect LT-STM performances-Ultra-Low Vibration (ULV) laboratory and the rigid STM head design are among them. Here, we present three improvements for the design of the ULV laboratory and the LT-STM: tip treatment stage, sample cleaving stage, and vibration isolation system. The improved tip treatment stage enables us to perform field emission for the purpose of tip treatment in situ without exchanging samples, while our enhanced sample cleaving stage allows us to cleave samples at low temperature in a vacuum without optical access by a simple pressing motion. Our newly designed vibration isolation system provides efficient space usage while maintaining vibration isolation capability. These improvements enhance the quality of spectroscopic imaging experiments that can last for many days and provide increased data yield, which we expect can be indispensable elements in future LT-STM designs.

  8. A cryogen-free low temperature scanning tunneling microscope capable of inelastic electron tunneling spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Zhang, Shuai; Huang, Di [State Key Laboratory of Surface Physics, Key Laboratory of Micro and Nano Photonic Structures (MOE), and Department of Physics, Fudan University, Shanghai 200433 (China); Wu, Shiwei, E-mail: swwu@fudan.edu.cn [State Key Laboratory of Surface Physics, Key Laboratory of Micro and Nano Photonic Structures (MOE), and Department of Physics, Fudan University, Shanghai 200433 (China); Collaborative Innovation Center of Advanced Microstructures, Fudan University, Shanghai 200433 (China)

    2016-06-15

    The design and performance of a cryogen-free low temperature scanning tunneling microscope (STM) housed in ultrahigh vacuum (UHV) are reported. The cryogen-free design was done by directly integrating a Gifford-McMahon cycle cryocooler to a Besocke-type STM, and the vibration isolation was achieved by using a two-stage rubber bellow between the cryocooler and a UHV-STM interface with helium exchange gas cooling. A base temperature of 15 K at the STM was achieved, with a possibility to further decrease by using a cryocooler with higher cooling power and adding additional low temperature stage under the exchange gas interface. Atomically sharp STM images and high resolution dI/dV spectra on various samples were demonstrated. Furthermore, we reported the inelastic tunneling spectroscopy on a single carbon monoxide molecule adsorbed on Ag(110) surface with a cryogen-free STM for the first time. Being totally cryogen-free, the system not only saves the running cost significantly but also enables uninterrupted data acquisitions and variable temperature measurements with much ease. In addition, the system is capable of coupling light to the STM junction by a pair of lens inside the UHV chamber. We expect that these enhanced capabilities could further broaden our views to the atomic-scale world.

  9. A cryogen-free low temperature scanning tunneling microscope capable of inelastic electron tunneling spectroscopy.

    Science.gov (United States)

    Zhang, Shuai; Huang, Di; Wu, Shiwei

    2016-06-01

    The design and performance of a cryogen-free low temperature scanning tunneling microscope (STM) housed in ultrahigh vacuum (UHV) are reported. The cryogen-free design was done by directly integrating a Gifford-McMahon cycle cryocooler to a Besocke-type STM, and the vibration isolation was achieved by using a two-stage rubber bellow between the cryocooler and a UHV-STM interface with helium exchange gas cooling. A base temperature of 15 K at the STM was achieved, with a possibility to further decrease by using a cryocooler with higher cooling power and adding additional low temperature stage under the exchange gas interface. Atomically sharp STM images and high resolution dI/dV spectra on various samples were demonstrated. Furthermore, we reported the inelastic tunneling spectroscopy on a single carbon monoxide molecule adsorbed on Ag(110) surface with a cryogen-free STM for the first time. Being totally cryogen-free, the system not only saves the running cost significantly but also enables uninterrupted data acquisitions and variable temperature measurements with much ease. In addition, the system is capable of coupling light to the STM junction by a pair of lens inside the UHV chamber. We expect that these enhanced capabilities could further broaden our views to the atomic-scale world.

  10. Microscopic studies of RIB target materials and ion induced nanostructures

    International Nuclear Information System (INIS)

    Karmakar, Prasanta; Bhattacharya, Shampa; Roy, Tapatee Kundu; Bhowmick, Debasis; Chakrabarti, Alok

    2010-01-01

    The invention of electron microscope and scanning probe microscope has empowered us to visualize the tiny world that has explored many fundamental laws of natures. Further technological advancements have made these tools capable to probe micron size structures to individual atom. These microscopes are used to image and study micron size fibers or grain structures used for high yield radioactive products, to few nanometer size ripple, dot and hole structures produced by ion irradiation. Electron Microscope has also been used to characterize the ion beam synthesized dilute magnetic systems

  11. Commissioning and modification of the low temperature scanning polarization microscope (TTSPM) and imaging of the local magnetic flux density distribution in superconducting niobium samples

    International Nuclear Information System (INIS)

    Gruenzweig, Matthias Sebastian Peter

    2014-01-01

    The dissertation is separated into two different parts, which will be presented in the following. Part I of the dissertation is about the commissioning and the modification of the ''low-temperature scanning polarization microscope'' which was designed in a previous dissertation of Stefan Guenon [1]. A scanning polarization microscope has certain advantages compared to conventional polarization microscopes. With a scanning polarization microscope it is easily possible to achieve a high illumination intensity, which is important to realize a high signal-to-noise ratio. Moreover, the confocal design of the scanning polarization microscope improves the resolution of the microscope by a factor of 1.4. Normally, it is not necessary to post-process the images by means of differential frame method to eliminate the contrast of non-magnetic origin. In contrast to conventional polarization microscopes the low-temperature scanning polarization microscope is able to image electronic transport properties via beam-induced voltage variation in addition to the magneto-optical effects. In this dissertation, it was possible to demonstrate the performance capability of the scanning polarization microscope at room temperature as well as at low temperatures. The investigation of the polar Kerr-effect has been carried out with a BaFe 12 O 19 -test sample whereas the measurements of the longitudinal Kerr-effect have been carried out with an in-plane magnetized acceleration sensor. Furthermore, an independent room temperature construction for out-of-plane measurements in a magnetic field up to 1 Tesla has been designed and implemented within the framework of a diploma thesis, supervised by the author of this dissertation. Using this construction, it was possible to gain experimental results regarding the interlayer exchange coupling between iron-terbium alloys (Fe 1-x Tb x ) and cobalt-platinum multilayers (vertical stroke Co/Pt vertical stroke n ). Indeed, it has been

  12. Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope

    Science.gov (United States)

    Wu, J.S.; Kim, A. M.; Bleher, R.; Myers, B.D.; Marvin, R. G.; Inada, H.; Nakamura, K.; Zhang, X.F.; Roth, E.; Li, S.Y.; Woodruff, T. K.; O'Halloran, T. V.; Dravid, Vinayak P.

    2013-01-01

    A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room- and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems. PMID:23500508

  13. A pragmatic guide to multiphoton microscope design

    Science.gov (United States)

    Young, Michael D.; Field, Jeffrey J.; Sheetz, Kraig E.; Bartels, Randy A.; Squier, Jeff

    2016-01-01

    Multiphoton microscopy has emerged as a ubiquitous tool for studying microscopic structure and function across a broad range of disciplines. As such, the intent of this paper is to present a comprehensive resource for the construction and performance evaluation of a multiphoton microscope that will be understandable to the broad range of scientific fields that presently exploit, or wish to begin exploiting, this powerful technology. With this in mind, we have developed a guide to aid in the design of a multiphoton microscope. We discuss source selection, optical management of dispersion, image-relay systems with scan optics, objective-lens selection, single-element light-collection theory, photon-counting detection, image rendering, and finally, an illustrated guide for building an example microscope. PMID:27182429

  14. Low temperature scanning electron microscopic studies on the interaction of globodera rostochiensis woll. and trichoderma harzianum rifai

    International Nuclear Information System (INIS)

    Saifullah, A.; Khan, N.U.

    2014-01-01

    Low temperature scanning electron microscopic (LTSEM) studies revealed that Trichoderma harzianum infected mature potato cysts nematode eggs by penetrating directly the cyst wall or via natural opening of mouth. Mycelial penetration on cyst wall or egg surface has been seen. The penetration of cyst wall or egg surface was either chemical or mechanical (directly or with appresorium) or both. Freeze fractionation showed the presence of mycelia inside the eggs. (author)

  15. Scanning Electron Microscope Studies of Interactions between Agaricus bisporus (Lang) Sing Hyphae and Bacteria in Casing Soil

    OpenAIRE

    Masaphy, Segula; Levanon, D.; Tchelet, R.; Henis, Y.

    1987-01-01

    Relationships between the hyphae of Agaricus bisporus (Lang) Sing and bacteria from the mushroom bed casing layer were examined with a scanning electron microscope. Hyphae growing in the casing layer differed morphologically from compost-grown hyphae. Whereas the compost contained thin single hyphae surrounded by calcium oxalate crystals, the casing layer contained mainly wide hyphae or mycelial strands without crystals. The bacterial population in the hyphal environment consisted of several ...

  16. Development of confocal laser microscope system for examination of microscopic characteristics of radiophotoluminescence glass dosemeters

    International Nuclear Information System (INIS)

    Maki, D.; Ishii, T.; Sato, F.; Kato, Y.; Yamamoto, T.; Iida, T.

    2011-01-01

    A confocal laser microscope system was developed for the measurement of radiophotoluminescence (RPL) photons emitted from a minute alpha-ray-irradiated area in an RPL glass dosemeter. The system was composed mainly of an inverted-type microscope, an ultraviolet laser, an XY movable stage and photon-counting circuits. The photon-counting circuits were effective in the reduction of the background noise level in the measurement of RPL photons. The performance of this microscope system was examined by the observation of standard RPL glass samples irradiated using 241 Am alpha rays. The spatial resolution of this system was ∼3 μm, and with regard to the sensitivity of this system, a hit of more than four to five alpha rays in unit area produced enough amount of RPL photons to construct the image. (authors)

  17. Development of confocal laser microscope system for examination of microscopic characteristics of radiophotoluminescence glass dosemeters.

    Science.gov (United States)

    Maki, Daisuke; Ishii, Tetsuya; Sato, Fuminobu; Kato, Yushi; Yamamoto, Takayoshi; Iida, Toshiyuki

    2011-03-01

    A confocal laser microscope system was developed for the measurement of radiophotoluminescence (RPL) photons emitted from a minute alpha-ray-irradiated area in an RPL glass dosemeter. The system was composed mainly of an inverted-type microscope, an ultraviolet laser, an XY movable stage and photon-counting circuits. The photon-counting circuits were effective in the reduction of the background noise level in the measurement of RPL photons. The performance of this microscope system was examined by the observation of standard RPL glass samples irradiated using (241)Am alpha rays. The spatial resolution of this system was ∼ 3 μm, and with regard to the sensitivity of this system, a hit of more than four to five alpha rays in unit area produced enough amount of RPL photons to construct the image.

  18. Re-evaluation of differential phase contrast (DPC) in a scanning laser microscope using a split detector as an alternative to differential interference contrast (DIC) optics.

    Science.gov (United States)

    Amos, W B; Reichelt, S; Cattermole, D M; Laufer, J

    2003-05-01

    In this paper, differential phase imaging (DPC) with transmitted light is implemented by adding a suitable detection system to a standard commercially available scanning confocal microscope. DPC, a long-established method in scanning optical microscopy, depends on detecting the intensity difference between opposite halves or quadrants of a split photodiode detector placed in an aperture plane. Here, DPC is compared with scanned differential interference contrast (DIC) using a variety of biological specimens and objective lenses of high numerical aperture. While DPC and DIC images are generally similar, DPC seems to have a greater depth of field. DPC has several advantages over DIC. These include low cost (no polarizing or strain-free optics are required), absence of a double scanning spot, electronically variable direction of shading and the ability to image specimens in plastic dishes where birefringence prevents the use of DIC. DPC is also here found to need 20 times less laser power at the specimen than DIC.

  19. Adapting a compact confocal microscope system to a two-photon excitation fluorescence imaging architecture.

    Science.gov (United States)

    Diaspro, A; Corosu, M; Ramoino, P; Robello, M

    1999-11-01

    Within the framework of a national National Institute of Physics of Matter (INFM) project, we have realised a two-photon excitation (TPE) fluorescence microscope based on a new generation commercial confocal scanning head. The core of the architecture is a mode-locked Ti:Sapphire laser (Tsunami 3960, Spectra Physics Inc., Mountain View, CA) pumped by a high-power (5 W, 532 nm) laser (Millennia V, Spectra Physics Inc.) and an ultracompact confocal scanning head, Nikon PCM2000 (Nikon Instruments, Florence, Italy) using a single-pinhole design. Three-dimensional point-spread function has been measured to define spatial resolution performances. The TPE microscope has been used with a wide range of excitable fluorescent molecules (DAPI, Fura-2, Indo-1, DiOC(6)(3), fluoresceine, Texas red) covering a single photon spectral range from UV to green. An example is reported on 3D imaging of the helical structure of the sperm head of the Octopus Eledone cirrhosa labelled with an UV excitable dye, i.e., DAPI. The system can be easily switched for operating both in conventional and two-photon mode. Copyright 1999 Wiley-Liss, Inc.

  20. Modification of a scanning electron microscope to produce Smith-Purcell radiation

    International Nuclear Information System (INIS)

    Kapp, Oscar H.; Sun, Yin-e; Kim, Kwang-Je; Crewe, Albert V.

    2004-01-01

    We have modified a scanning electron microscope (SEM) in an attempt to produce a miniature free electron laser that can produce radiation in the far infrared region, which is difficult to obtain otherwise. This device is similar to the instrument studied by the Dartmouth group and functions on the basic principles first described by Smith and Purcell. The electron beam of the SEM is passed over a metal grating and should be capable of producing photons either in the spontaneous emission regime or in the superradiance regime if the electron beam is sufficiently bright. The instrument is capable of being continuously tuned by virtue of the period of the metal grating and the choice of accelerating voltage. The emitted Smith-Purcell photons exit the instrument via a polyethylene window and are detected by an infrared bolometer. Although we have obtained power levels exceeding nanowatts in the spontaneous emission regime, we have thus far not been able to detect a clear example of superradiance