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Sample records for scanning force microscope

  1. Photon scanning tunneling microscope in combination with a force microscope

    NARCIS (Netherlands)

    Moers, M.H.P.; Moers, M.H.P.; Tack, R.G.; van Hulst, N.F.; Bölger, B.; Bölger, B.

    1994-01-01

    The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected

  2. Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope

    DEFF Research Database (Denmark)

    Jensen, Carsten P.

    Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope......Calibrated atomic force microscope measurements of vickers hardness indentations and tip production and characterisation for scanning tunelling microscope...

  3. Operation of a scanning near field optical microscope in reflection in combination with a scanning force microscope

    NARCIS (Netherlands)

    van Hulst, N.F.; Moers, M.H.P.; Moers, M.H.P.; Noordman, O.F.J.; Noordman, O.F.J.; Faulkner, T.; Segerink, Franciscus B.; van der Werf, Kees; de Grooth, B.G.; Bölger, B.; Bölger, B.

    1992-01-01

    Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an

  4. A versatile atomic force microscope integrated with a scanning electron microscope

    Science.gov (United States)

    Kreith, J.; Strunz, T.; Fantner, E. J.; Fantner, G. E.; Cordill, M. J.

    2017-05-01

    A versatile atomic force microscope (AFM), which can be installed in a scanning electron microscope (SEM), is introduced. The flexible design of the instrument enables correlated analysis for different experimental configurations, such as AFM imaging directly after nanoindentation in vacuum. In order to demonstrate the capabilities of the specially designed AFM installed inside a SEM, slip steps emanating around nanoindents in single crystalline brass were examined. This example showcases how the combination of AFM and SEM imaging can be utilized for quantitative dislocation analysis through the measurement of the slip step heights without the hindrance of oxide formation. Finally, an in situ nanoindentation technique is introduced, illustrating the use of AFM imaging during indentation experiments to examine plastic deformation occurring under the indenter tip. The mechanical indentation data are correlated to the SEM and AFM images to estimate the number of dislocations emitted to the surface.

  5. Electron beam detection of a Nanotube Scanning Force Microscope.

    Science.gov (United States)

    Siria, Alessandro; Niguès, Antoine

    2017-09-14

    Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM forced the introduction of a new class of resonators with dimensions at the nanometer scale. In this context, nanotubes are the ultimate mechanical oscillators because of their one dimensional nature, small mass and almost perfect crystallinity. Coupled to the possibility of functionalisation, these properties make them the perfect candidates as ultra sensitive, on-demand force sensors. However their dimensions make the measurement of the mechanical properties a challenging task in particular when working in cavity free geometry at ambient temperature. By using a focused electron beam, we show that the mechanical response of nanotubes can be quantitatively measured while approaching to a surface sample. By coupling electron beam detection of individual nanotubes with a custom AFM we image the surface topography of a sample by continuously measuring the mechanical properties of the nanoresonators. The combination of very small size and mass together with the high resolution of the electron beam detection method offers unprecedented opportunities for the development of a new class of nanotube-based scanning force microscopy.

  6. A scanning force microscope for simultaneous force and patch-clamp measurements on living cell tissues

    Science.gov (United States)

    Langer, M. G.; Öffner, W.; Wittmann, H.; Flösser, H.; Schaar, H.; Häberle, W.; Pralle, A.; Ruppersberg, J. P.; Hörber, J. K. H.

    1997-06-01

    For the investigation of mechanosensitive ion channels of living cells it is of great interest to apply very local forces in the piconewton range and to measure, simultaneously, ion currents down to 1 pA. Scanning force microscopy (SFM) is a suitable technique, that allows the application of such small forces with a lateral resolution in the range of 10 nm. We developed a novel type of experimental setup, because no existing SFM, home built or commercial, allows a simultaneous investigation of ion currents and mechanical properties of living cells. The construction consists of a SFM that is combined with an upright infrared differential interference contrast (DIC) video microscope and a conventional patch-clamp setup. Instead of the object, the force sensor is scanned to prevent relative movements between the patch pipette and the patched cell. The deflection of the SFM cantilever is detected with the so-called optical deflection method through the objective of the optical microscope. In opposite to common optical setups the laser beam was not focused on the force sensor. The presented optic creates a parallel laser beam between the objective and the SFM cantilever, which allows a vertical displacement of the sensor without any changes of the detector signal. For the three-dimensional positioning of the specimen chamber a two-axis translation stage including a vertical piezoelectric translation device was developed. The SFM tip is fixed on a combined lateral and vertical translation stage including a piezoelectric tube scanner for three-dimensional fine positioning. Thus the instrument enables an easy approach of the SFM tip to any optically identified cell structure. The head stage of the patch-clamp electronics and the patch pipette are directly fixed on the specimen stage. This prevents relative movements between patched cells and patch pipette during the approach to the SFM tip. The three-axis positioning of the patch pipette is done by a compact hydraulic

  7. Development of a shear force scanning near-field fluorescence microscope for biological applications.

    Science.gov (United States)

    Shang, G Y; Qiao, W H; Lei, F H; Angiboust, J-F; Troyon, M; Manfait, M

    2005-11-01

    In this paper, a shear force scanning near-field fluorescence microscope combined with a confocal laser microspectrofluorometer is described. The shear force detection is realized based on a bimorph cantilever, which provides a very sensitive, reliable, and easy to use method to control the probe-sample distance during scanning. With the system, high-quality shear force imaging of various samples has been carried out. Furthermore, simultaneous shear force and near-field fluorescence imaging of biological cells has also been realized. As an example, we especially present the result on the distribution of P-glycoprotein in the plasma membrane of human small cell lung cancer cells, suggesting that the system would be a promising tool for biological applications.

  8. Verification of cell viability at progressively higher scanning forces using a hybrid atomic force and fluorescence microscope.

    Science.gov (United States)

    Barnes, C A; O'Hagan, B M G; Howard, C V; McKerr, G

    2007-11-01

    The prudent use of the atomic force microscope as a supra-vital live cell imaging tool requires that cell viability must be determined before and after scanning. Complementary optical techniques in conjunction with the fluorescent dyes rhodamine-123 and ethidium homodimer have been used within this study to determine cell viability after increasing loads are applied in contact mode. Guideline force ranges for five commonly cultured cell lines, human squamous carcinoma (A431), fibroblast, HeLa, Potorous tridactylis (PtK2) and rat intestinal epithelial (RIE) cells are given.

  9. The Scanning Optical Microscope.

    Science.gov (United States)

    Sheppard, C. J. R.

    1978-01-01

    Describes the principle of the scanning optical microscope and explains its advantages over the conventional microscope in the improvement of resolution and contrast, as well as the possibility of producing a picture from optical harmonies generated within the specimen.

  10. Scanning Auger Electron Microscope

    Data.gov (United States)

    Federal Laboratory Consortium — A JEOL model 7830F field emission source, scanning Auger microscope.Specifications / Capabilities:Ultra-high vacuum (UHV), electron gun range from 0.1 kV to 25 kV,...

  11. Application of Tuning Fork Sensors for In-situ Studies of Dynamic Force Interactions Inside Scanning and Transmission Electron Microscopes

    Directory of Open Access Journals (Sweden)

    Jana ANDZANE

    2012-06-01

    Full Text Available Mechanical properties of nanoscale contacts have been probed in-situ by specially developed force sensor based on a quartz tuning fork resonator (TF. Additional control is provided by observation of process in scanning electron microscope (SEM and transmission electron microscope (TEM. A piezoelectric manipulator allows precise positioning of atomic force microscope (AFM probe in contact with another electrode and recording of the TF oscillation amplitude and phase while simultaneously visualizing the contact area in electron microscope. Electrostatic control of interaction between the electrodes is demonstrated during observation of the experiment in SEM. In the TEM system the TF sensor operated in shear force mode: Use of TEM allowed for direct control of separation between electrodes. New opportunities for in situ studies of nanomechanical systems using these instruments are discussed.DOI: http://dx.doi.org/10.5755/j01.ms.18.2.1927

  12. Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures' optical properties.

    Science.gov (United States)

    Bercu, N B; Troyon, M; Molinari, M

    2016-09-01

    An original scanning near-field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM-based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near-field cathodoluminescence and topographic images of the sample. Share-force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques. © 2016 The Authors Journal of Microscopy © 2016 Royal Microscopical Society.

  13. Scanning transmission electron microscope

    NARCIS (Netherlands)

    Kruit, P.

    2006-01-01

    The invention relates to a scanning transmission electron microscope comprising an electron source, an electron accelerator and deflection means for directing electrons emitted by the electron source at an object to be examined, and in addition a detector for detecting electrons coming from the

  14. Terahertz scanning probe microscope

    NARCIS (Netherlands)

    Klapwijk, T.M.

    2014-01-01

    The invention provides aterahertz scanning probe microscope setup comprising (i) a terahertz radiation source configured to generate terahertz radiation; (ii) a terahertz lens configured to receive at least part of the terahertz radiation from the terahertz radiation source; (iii) a cantilever unit

  15. SPM: Scanning positron microscope

    Directory of Open Access Journals (Sweden)

    Marcel Dickmann

    2015-08-01

    Full Text Available The Munich scanning positron microscope, operated by the Universität der Bundeswehr München and the Technische Universität München, located at NEPOMUC, permits positron lifetime measurements with a lateral resolution in the µm range and within an energy range of 1 – 20 keV.

  16. A Student-Built Scanning Tunneling Microscope

    Science.gov (United States)

    Ekkens, Tom

    2015-01-01

    Many introductory and nanotechnology textbooks discuss the operation of various microscopes including atomic force (AFM), scanning tunneling (STM), and scanning electron microscopes (SEM). In a nanotechnology laboratory class, students frequently utilize microscopes to obtain data without a thought about the detailed operation of the tool itself.…

  17. Laser Scanning Fluorescence Microscope

    Science.gov (United States)

    Hansen, Eric W.; Zelten, J. Peter; Wiseman, Benjamin A.

    1988-06-01

    We report on the development of a laser scanning fluorescence microscope possessing several features which facilitate its application to biological and biophysical analyses in living cells. It is built around a standard inverted microscope stand, enabling the use of standard optics, micromanipulation apparatus, and conventional (including video) microscopy in conjunction with laser scanning. The beam is scanned across the specimen by a pair of galvanometer-mounted mirrors, driven by a programmable controller which can operate in three modes: full raster scan, region of interest, and random-access. A full 512x512 pixel image can be acquired in one second. In region of interest mode, several subareas of the field can be selected for more rapid or detailed analysis. For those cases where the time scale of the observed phenomenon precludes full-field imaging, or where a full-field image is unnecessary, the random access mode enables an arbitrary pattern of isolated points to be selected and rapidly sequenced through. Via a graphical user interface implemented on the system's host computer, a user will be able to take a scout image either with video or a full-field laser scan, select regions or points on the scout image with a mouse, and set up experimental parameters such as detector integration times with a window-style menu. The instrument is designed to be a flexible testbed for investigating new techniques, without compromising its utility as a tool for biological research.

  18. Scanning transmission electron microscope

    OpenAIRE

    Kruit, P.

    2006-01-01

    The invention relates to a scanning transmission electron microscope comprising an electron source, an electron accelerator and deflection means for directing electrons emitted by the electron source at an object to be examined, and in addition a detector for detecting electrons coming from the object and, connected to the detector, a device for processing the detected electrons so as to form an object image, wherein a beam splitter is provided for dividing the electron beam from the electron...

  19. Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

    Directory of Open Access Journals (Sweden)

    Urs Gysin

    2015-12-01

    Full Text Available Background: The resolution in electrostatic force microscopy (EFM, a descendant of atomic force microscopy (AFM, has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the characterization of conducting or semiconducting power devices with EFM methods requires an accurate and reliable technique from the nanometre up to the micrometre scale. For high force sensitivity it is indispensable to operate the microscope under high to ultra-high vacuum (UHV conditions to suppress viscous damping of the sensor. Furthermore, UHV environment allows for the analysis of clean surfaces under controlled environmental conditions. Because of these requirements we built a large area scanning probe microscope operating under UHV conditions at room temperature allowing to perform various electrical measurements, such as Kelvin probe force microscopy, scanning capacitance force microscopy, scanning spreading resistance microscopy, and also electrostatic force microscopy at higher harmonics. The instrument incorporates beside a standard beam deflection detection system a closed loop scanner with a scan range of 100 μm in lateral and 25 μm in vertical direction as well as an additional fibre optics. This enables the illumination of the tip–sample interface for optically excited measurements such as local surface photo voltage detection.Results: We present Kelvin probe force microscopy (KPFM measurements before and after sputtering of a copper alloy with chromium grains used as electrical contact surface in ultra-high power switches. In addition, we discuss KPFM measurements on cross sections of cleaved silicon carbide structures: a calibration layer sample and a power rectifier. To demonstrate the benefit of surface photo voltage measurements, we analysed the contact potential difference of a silicon carbide p/n-junction under illumination.

  20. Scanning laser video camera/ microscope

    Science.gov (United States)

    Wang, C. P.; Bow, R. T.

    1984-10-01

    A laser scanning system capable of scanning at standard video rate has been developed. The scanning mirrors, circuit design and system performance, as well as its applications to video cameras and ultra-violet microscopes, are discussed.

  1. Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

    Science.gov (United States)

    Zhao, Jianyong; Gong, Weitao; Cai, Wei; Shang, Guangyi

    2013-08-01

    A piezoelectric bimorph-based scanner operating in tip-scan mode for high speed atomic force microscope (AFM) is first presented. The free end of the bimorph is used for fixing an AFM cantilever probe and the other one is mounted on the AFM head. The sample is placed on the top of a piezoelectric tube scanner. High speed scan is performed with the bimorph that vibrates at the resonant frequency, while slow scanning is carried out by the tube scanner. The design and performance of the scanner is discussed and given in detailed. Combined with a commercially available data acquisition system, a high speed AFM has been built successfully. By real-time observing the deformation of the pores on the surface of a commercial piezoelectric lead zirconate titanate (PZT-5) ceramics under electric field, the dynamic imaging capability of the AFM is demonstrated. The results show that the notable advantage of the AFM is that dynamic process of the sample with large dimensions can be easily investigated. In addition, this design could provide a way to study a sample in real time under the given experimental condition, such as under an external electric field, on a heating stage, or in a liquid cell.

  2. Acquire an Bruker Dimension FastScanTM Atomic Force Microscope (AFM) for Materials, Physical and Biological Science Research and Education

    Science.gov (United States)

    2016-04-14

    SECURITY CLASSIFICATION OF: The DOD HBCU/MI instrumentation award provided us a rare opportunity to acquire a Bruker Dimension FastScanTM Atomic ...UU 14-04-2016 1-Jan-2015 31-Jan-2016 Final Report: Acquire an Bruker Dimension FastScanTM Atomic Force Microscope (AFM) for Materials, Physical and...NAME(S) AND ADDRESS (ES) U.S. Army Research Office P.O. Box 12211 Research Triangle Park, NC 27709-2211 Atomic Force Microscope, self-assembly

  3. A fluorescence scanning electron microscope

    OpenAIRE

    Kanemaru, Takaaki; Hirata, Kazuho; Takasu, Shin-ichi; Isobe, Shin-Ichiro; Mizuki, Keiji; Mataka, Shuntaro; Nakamura, Kei-ichiro

    2010-01-01

    Fluorescence techniques are widely used in biological research to examine molecular localization, while electron microscopy can provide unique ultrastructural information. To date, correlative images from both fluorescence and electron microscopy have been obtained separately using two different instruments, i.e. a fluorescence microscope (FM) and an electron microscope (EM). In the current study, a scanning electron microscope (SEM) (JEOL JXA8600 M) was combined with a fluorescence digital c...

  4. Phase sensitive scanning optical microscope

    Energy Technology Data Exchange (ETDEWEB)

    Jungerman, R.L.; Hobbs, P.C.D.; Kino, G.S.

    1984-10-15

    An electronically scanned optical microscope which quantitatively measures amplitude and phase is described. The system is insenstive to mechanical vibrations. The phase infromation makes it possible to measure surface height variations with an accuracy of better than 100 A and can also be used to improve the lateral resolution.

  5. Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Day, R.D.; Russell, P.E.

    1988-12-01

    The Atomic Force Microscope (AFM) is a recently developed instrument that has achieved atomic resolution imaging of both conducting and non- conducting surfaces. Because the AFM is in the early stages of development, and because of the difficulty of building the instrument, it is currently in use in fewer than ten laboratories worldwide. It promises to be a valuable tool for obtaining information about engineering surfaces and aiding the .study of precision fabrication processes. This paper gives an overview of AFM technology and presents plans to build an instrument designed to look at engineering surfaces.

  6. Scanning Quantum Cryogenic Atom Microscope

    Science.gov (United States)

    Yang, Fan; Kollár, Alicia J.; Taylor, Stephen F.; Turner, Richard W.; Lev, Benjamin L.

    2017-03-01

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed-matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented dc-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a field sensitivity of 1.4 nT per resolution-limited point (approximately 2 μ m ) or 6 nT /√{Hz } per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly 100 points with an effective field sensitivity of 600 pT /√{Hz } for each point during the same time as a point-by-point scanner measures these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly 2 orders of magnitude improvement in magnetic flux sensitivity (down to 10-6 Φ0/√{Hz } ) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns in a system where samples may be scanned, cryogenically cooled, and easily exchanged. We anticipate the SQCRAMscope will provide charge-transport images at temperatures from room temperature to 4 K in unconventional superconductors and topologically nontrivial materials.

  7. Atomic force microscope featuring an integrated optical microscope

    NARCIS (Netherlands)

    Putman, C.A.J.; Putman, Constant A.J.; de Grooth, B.G.; van Hulst, N.F.; Greve, Jan

    1992-01-01

    The atomic force microscope (AFM) is used to image the surface of both conductors and nonconductors. Biological specimens constitute a large group of nonconductors. A disadvantage of most AFM's is the fact that relatively large areas of the sample surface have to be scanned to pinpoint a biological

  8. Scanning Electron Microscope Analysis System

    Data.gov (United States)

    Federal Laboratory Consortium — This facility provides the capability to examine surfaces microscopically with high resolution (5 nanometers), perform micro chemical analyses of these surfaces, and...

  9. Multibeam scanning electron microscope : Experimental results

    NARCIS (Netherlands)

    Mohammadi-Gheidari, A.; Hagen, C.W.; Kruit, P.

    2010-01-01

    The authors present the first results obtained with their multibeam scanning electron microscope. For the first time, they were able to image 196 (array of 14×14) focused beams of a multielectron beam source on a specimen using single beam scanning electron microscope (SEM) optics. The system

  10. Magnetic Resonance Force Microscope Development

    Energy Technology Data Exchange (ETDEWEB)

    Hammel, P.C.; Zhang, Z.; Suh, B.J.; Roukes, M.L.; Midzor, M.; Wigen, P.E.; Childress, J.R.

    1999-06-03

    Our objectives were to develop the Magnetic Resonance Force Microscope (MRFM) into an instrument capable of scientific studies of buried structures in technologically and scientifically important electronic materials such as magnetic multilayer materials. This work resulted in the successful demonstration of MRFM-detected ferromagnetic resonance (FMR) as a microscopic characterization tool for thin magnetic films. Strong FMR spectra obtained from microscopic Co thin films (500 and 1000 angstroms thick and 40 x 200 microns in lateral extent) allowed us to observe variations in sample inhomogeneity and magnetic anisotropy field. We demonstrated lateral imaging in microscopic FMR for the first time using a novel approach employing a spatially selective local field generated by a small magnetically polarized spherical crystallite of yttrium iron garnet. These successful applications of the MRFM in materials studies provided the basis for our successful proposal to DOE/BES to employ the MRF M in studies of buried interfaces in magnetic materials.

  11. Scanning laser microscope for biological investigations.

    Science.gov (United States)

    Davidovits, P; Egger, M D

    1971-07-01

    The theory and design of a special purpose scanning laser microscope are described. This microscope, particularly suited for biological investigations, is intended for the observation of objects embedded within transparent or translucent bodies, such as nerve cells in an intact brain. Some photographs made with a prototype are shown.

  12. Scanning tunneling microscope assembly, reactor, and system

    Science.gov (United States)

    Tao, Feng; Salmeron, Miquel; Somorjai, Gabor A

    2014-11-18

    An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.

  13. A video rate laser scanning confocal microscope

    Science.gov (United States)

    Ma, Hongzhou; Jiang, James; Ren, Hongwu; Cable, Alex E.

    2008-02-01

    A video-rate laser scanning microscope was developed as an imaging engine to integrate with other photonic building blocks to fulfill various microscopic imaging applications. The system is quipped with diode laser source, resonant scanner, galvo scanner, control electronic and computer loaded with data acquisition boards and imaging software. Based on an open frame design, the system can be combined with varies optics to perform the functions of fluorescence confocal microscopy, multi-photon microscopy and backscattering confocal microscopy. Mounted to the camera port, it allows a traditional microscope to obtain confocal images at video rate. In this paper, we will describe the design principle and demonstrate examples of applications.

  14. A Scanning Quantum Cryogenic Atom Microscope

    CERN Document Server

    Yang, Fan; Taylor, Stephen F; Turner, Richard W; Lev, Benjamin L

    2016-01-01

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a noise floor of 300 pT and provides a 100x improvement in magnetic flux sensitivity over previous atomic scanning probe magnetometers. These capabilities are carefully benchmarked by imaging magnet...

  15. Fiber coupled ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1997-01-01

    We report on a scanning tunneling microscope with a photoconductive gate in the tunneling current circuit. The tunneling tip is attached to a coplanar transmission line with an integrated photoconductive switch. The switch is illuminated through a fiber which is rigidly attached to the switch...

  16. Performance of the SRRC scanning photoelectron microscope

    CERN Document Server

    Hong, I H; Yin, G C; Wei, D H; Juang, J M; Dann, T E; Klauser, R; Chuang, T J; Chen, C T; Tsang, K L

    2001-01-01

    A scanning photoelectron microscope has been constructed at SRRC. This SPEM system consists primarily of a Fresnel zone plate (ZP) with an order-selection aperture, a flexure scanning stage, a hemispherical electron analyzer, and sample/ZP insertion system. The flexure stage is used to scan the sample. A hemispherical analyzer with Omni V lens and a 16-channel multichannel detector (MCD) is used to collect photoelectrons. A set of 16 photoelectron images at different kinetic energies can be simultaneously acquired in one single scan. The data acquisition system is designed to collect up to 32 images concurrently, including 16 MCD signals, total electron yield and transmitted photon flux. The design and some initial test results of this SPEM station are presented and discussed.

  17. Development of Scanning Ultrafast Electron Microscope Capability.

    Energy Technology Data Exchange (ETDEWEB)

    Collins, Kimberlee Chiyoko [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Talin, Albert Alec [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Chandler, David W. [Sandia National Lab. (SNL-CA), Livermore, CA (United States); Michael, Joseph R. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2016-11-01

    Modern semiconductor devices rely on the transport of minority charge carriers. Direct examination of minority carrier lifetimes in real devices with nanometer-scale features requires a measurement method with simultaneously high spatial and temporal resolutions. Achieving nanometer spatial resolutions at sub-nanosecond temporal resolution is possible with pump-probe methods that utilize electrons as probes. Recently, a stroboscopic scanning electron microscope was developed at Caltech, and used to study carrier transport across a Si p-n junction [ 1 , 2 , 3 ] . In this report, we detail our development of a prototype scanning ultrafast electron microscope system at Sandia National Laboratories based on the original Caltech design. This effort represents Sandia's first exploration into ultrafast electron microscopy.

  18. Scanning electron microscopic observations on bone.

    Science.gov (United States)

    Anderson, C; Danylchuk, K D

    1977-01-01

    The maceration technique employed in the preparation of specimens of bone for museum purposes has also been found to be of use in the preparation of fresh specimens for study with the scanning electron microscope. The technique requires less technical supervision, permits a greater underprocessing to overprocessing margin, and allows comparability of recent biopsy material with previously macerated bone specimens with no less detail than that found by other authors using other techniques on biopsy material.

  19. A Scanning Quantum Cryogenic Atom Microscope

    Science.gov (United States)

    Lev, Benjamin

    Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room-to-cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. The SQCRAMscope has a field sensitivity of 1.4 nT per resolution-limited point (2 um), or 6 nT / Hz1 / 2 per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly one-hundred points with an effective field sensitivity of 600 pT / Hz1 / 2 each point during the same time as a point-by-point scanner would measure these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly two orders of magnitude improvement in magnetic flux sensitivity (down to 10- 6 Phi0 / Hz1 / 2) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are for the first time carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns and done so using samples that may be scanned, cryogenically cooled, and easily exchanged. We anticipate the SQCRAMscope will provide charge transport images at temperatures from room to \\x9D4K in unconventional superconductors and topologically nontrivial materials.

  20. The scanning ion conductance microscope for cellular physiology.

    Science.gov (United States)

    Lab, Max J; Bhargava, Anamika; Wright, Peter T; Gorelik, Julia

    2013-01-01

    The quest for nonoptical imaging methods that can surmount light diffraction limits resulted in the development of scanning probe microscopes. However, most of the existing methods are not quite suitable for studying biological samples. The scanning ion conductance microscope (SICM) bridges the gap between the resolution capabilities of atomic force microscope and scanning electron microscope and functional capabilities of conventional light microscope. A nanopipette mounted on a three-axis piezo-actuator, scans a sample of interest and ion current is measured between the pipette tip and the sample. The feedback control system always keeps a certain distance between the sample and the pipette so the pipette never touches the sample. At the same time pipette movement is recorded and this generates a three-dimensional topographical image of the sample surface. SICM represents an alternative to conventional high-resolution microscopy, especially in imaging topography of live biological samples. In addition, the nanopipette probe provides a host of added modalities, for example using the same pipette and feedback control for efficient approach and seal with the cell membrane for ion channel recording. SICM can be combined in one instrument with optical and fluorescent methods and allows drawing structure-function correlations. It can also be used for precise mechanical force measurements as well as vehicle to apply pressure with precision. This can be done on living cells and tissues for prolonged periods of time without them loosing viability. The SICM is a multifunctional instrument, and it is maturing rapidly and will open even more possibilities in the near future.

  1. Atomic Force Microscope Mediated Chromatography

    Science.gov (United States)

    Anderson, Mark S.

    2013-01-01

    The atomic force microscope (AFM) is used to inject a sample, provide shear-driven liquid flow over a functionalized substrate, and detect separated components. This is demonstrated using lipophilic dyes and normal phase chromatography. A significant reduction in both size and separation time scales is achieved with a 25-micron-length column scale, and one-second separation times. The approach has general applications to trace chemical and microfluidic analysis. The AFM is now a common tool for ultra-microscopy and nanotechnology. It has also been demonstrated to provide a number of microfluidic functions necessary for miniaturized chromatography. These include injection of sub-femtoliter samples, fluidic switching, and sheardriven pumping. The AFM probe tip can be used to selectively remove surface layers for subsequent microchemical analysis using infrared and tip-enhanced Raman spectroscopy. With its ability to image individual atoms, the AFM is a remarkably sensitive detector that can be used to detect separated components. These diverse functional components of microfluidic manipulation have been combined in this work to demonstrate AFM mediated chromatography. AFM mediated chromatography uses channel-less, shear-driven pumping. This is demonstrated with a thin, aluminum oxide substrate and a non-polar solvent system to separate a mixture of lipophilic dyes. In conventional chromatographic terms, this is analogous to thin-layer chromatography using normal phase alumina substrate with sheardriven pumping provided by the AFM tip-cantilever mechanism. The AFM detection of separated components is accomplished by exploiting the variation in the localized friction of the separated components. The AFM tip-cantilever provides the mechanism for producing shear-induced flows and rapid pumping. Shear-driven chromatography (SDC) is a relatively new concept that overcomes the speed and miniaturization limitations of conventional liquid chromatography. SDC is based on a

  2. Mechanochemistry Induced Using Force Exerted by a Functionalized Microscope Tip

    DEFF Research Database (Denmark)

    Zhang, Yajie; Wang, Yongfeng; Lü, Jing-Tao

    2017-01-01

    Atomic-scale mechanochemistry is realized from force exerted by a C60 -functionalized scanning tunneling microscope tip. Two conformers of tin phthalocyanine can be prepared on coinage-metal surfaces. A transition between these conformers is induced on Cu(111) and Ag(100). Density-functional calc......Atomic-scale mechanochemistry is realized from force exerted by a C60 -functionalized scanning tunneling microscope tip. Two conformers of tin phthalocyanine can be prepared on coinage-metal surfaces. A transition between these conformers is induced on Cu(111) and Ag(100). Density...

  3. Nanofabrication of magnetic scanned-probe microscope sensors

    CERN Document Server

    Chong, B K

    2001-01-01

    experiments were carried out under ambient conditions. The experiments required no extra preparation to be done to the specimen before imaging and measurements were carried out under ambient conditions. These probes offer the prospect of direct magnetic field measurement, non- invasiveness, very close proximity, possible local manipulation, better control over the tip- specimen interaction distance and topographic imaging. It is hoped that these magnetic microscope probes will be of great interest and general utility for academic and industrial magneticians. This thesis presents the development of novel magnetic sensor combined with Atomic Force Microscope probe (AFM) using conventional semiconductor processing techniques and Electron Beam Lithography (EBL). The fabrication of these magnetic sensors was performed on a common micromachined silicon substrate using a generic batch fabrication technique. Sub-micron Hall bar for Scanning Hall probe Microscopy (SHPM) and electromagnetic force coil magnet for Scanni...

  4. Dopant profiling with the scanning electron microscope

    CERN Document Server

    Elliott, S L

    2001-01-01

    This dissertation is a detailed study of dopant profiling with the scanning electron microscope (SEM) using secondary electrons. The technique has been applied to a wide variety of doped silicon, gallium arsenide and gallium nitride semiconductor test structures as well as a metal-oxide field effect transistor and several light emitting diodes. A concise set of guide-lines are provided for users of this technique, including the optimum SEM operating conditions that should be used for maximum contrast, an image manipulation procedure, and the resolution and sensitivity limits that can be expected. Dopant contrast observed with the SEM has been studied over the past few years by a number of researchers, and a theory for the contrast has evolved. This theory considers the patch fields outside the specimen to be the dominant factor determining the secondary electron intensity. In this dissertation the contrast mechanism has been further investigated by examining the contrast at different temperatures and after su...

  5. Scanning tunneling microscope spectroscopy of polymers.

    Science.gov (United States)

    Zypman, Fredy R

    2002-01-01

    This paper presents theoretical results on the relationship between density of states (DOS) and scanning tunneling microscope current-voltage curves in polymers. We considered samples of linear hydrocarbons electrically grounded at one of their extremes. The other extreme is electrically connected to the microscope tip via electron tunneling through vacuum. When a voltage, V, is applied to the tip, electric current, I, flows in the tip-sample circuit. This current varies as the voltage varies and depends on the DOS to the extent that no current would flow if no electron states exist at a certain energy (or voltage). The detailed relationship between DOS and the current-voltage (I-V) curve is not known a priori. We solve the corresponding quantum problem in the context of tight binding and find that I-V reproduces accurately the resonant energy peaks of the DOS. We apply the results to 100 atom-long alkane and alkene chains and found that there is a significant voltage shift in the corresponding curves as to discriminate one structure from the other.

  6. Cathodoluminescence in the scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kociak, M., E-mail: mathieu.kociak@u-psud.fr [Laboratoire de Physique des Solides, Université Paris-SudParis-Sud, CNRS-UMR 8502, Orsay 91405 (France); Zagonel, L.F. [“Gleb Wataghin” Institute of Physics University of Campinas - UNICAMP, 13083-859 Campinas, São Paulo (Brazil)

    2017-05-15

    Cathodoluminescence (CL) is a powerful tool for the investigation of optical properties of materials. In recent years, its combination with scanning transmission electron microscopy (STEM) has demonstrated great success in unveiling new physics in the field of plasmonics and quantum emitters. Most of these results were not imaginable even twenty years ago, due to conceptual and technical limitations. The purpose of this review is to present the recent advances that broke these limitations, and the new possibilities offered by the modern STEM-CL technique. We first introduce the different STEM-CL operating modes and the technical specificities in STEM-CL instrumentation. Two main classes of optical excitations, namely the coherent one (typically plasmons) and the incoherent one (typically light emission from quantum emitters) are investigated with STEM-CL. For these two main classes, we describe both the physics of light production under electron beam irradiation and the physical basis for interpreting STEM-CL experiments. We then compare STEM-CL with its better known sister techniques: scanning electron microscope CL, photoluminescence, and electron energy-loss spectroscopy. We finish by comprehensively reviewing recent STEM-CL applications. - Highlights: • Reviews the field of STEM-CL. • Introduces the technical requirements and challenges for STEM-CL. • Introduces the different types of excitations probed by STEM-CL. • Gives comprehensive overview of the last fifteenth years in the field.

  7. Atomic force microscope with integrated optical microscope for biological applications

    NARCIS (Netherlands)

    Putman, Constant A.J.; Putman, C.A.J.; van der Werf, Kees; de Grooth, B.G.; van Hulst, N.F.; Segerink, Franciscus B.; Greve, Jan

    1992-01-01

    Since atomic force microscopy (AFM) is capable of imaging nonconducting surfaces, the technique holds great promises for high‐resolution imaging of biological specimens. A disadvantage of most AFMs is the fact that the relatively large sample surface has to be scanned multiple times to pinpoint a

  8. Measuring Forces between Oxide Surfaces Using the Atomic Force Microscope

    DEFF Research Database (Denmark)

    Pedersen, Henrik Guldberg; Høj, Jakob Weiland

    1996-01-01

    The interactions between colloidal particles play a major role in processing of ceramics, especially in casting processes. With the Atomic Force Microscope (AFM) it is possible to measure the inter-action force between a small oxide particle (a few micron) and a surface as function of surface...

  9. Manipulation and soldering of carbon nanotubes using atomic force microscope

    Science.gov (United States)

    Kashiwase, Yuta; Ikeda, Takayuki; Oya, Takahide; Ogino, Toshio

    2008-09-01

    Manipulation of carbon nanotubes (CNTs) by an atomic force microscope (AFM) and soldering of CNTs using Fe oxide nanoparticles are described. We succeeded to separate a CNT bundle into two CNTs or CNT bundles, to move the separated CNT to a desirable position, and to bind it to another bundle. For the accurate manipulation, load of the AFM cantilever and frequency of the scan were carefully selected. We soldered two CNTs using an Fe oxide nanoparticle prepared from a ferritin molecule. The adhesion forces between the soldered CNTs were examined by an AFM and it was found that the CNTs were bound, though the binding force was not strong.

  10. Study of the mapping mechanism of ferroelectric domains with the scanning force microscope; Untersuchung der Abbildungsmechanismen ferroelektrischer Domaenen mit dem Rasterkraftmikroskop

    Energy Technology Data Exchange (ETDEWEB)

    Jungk, T.

    2006-12-15

    The piezo-force microscopy (PFM) allows the mapping of ferroelectric domains until the nanometer range. In spite of its simple function principle it was hitherto not completely understood. In ordser to develop the PFM further to a quantitative analysis method its methodical aspects were analyzed. It was shown that the fundamental mapping mechanism is based on the inverse piezo-effect. Different artefacts to be found in the literature could therefore be reduced to a measurement background. Furthermore the influence of the electrode geometry was analyzed. The width of doamin walls was systematically measured and simulated with a mode, whereby a maximal resolution of 17 nm was reached. By the development of a correction procedure for the exact detection of the forces acting on the spring-beam the lateral signals measured on domain walls could by newly interpreted. So the ''Lateral Electrostatic Force Microscopy'' was developed.

  11. Scanning microscopic four-point conductivity probes

    DEFF Research Database (Denmark)

    Petersen, Christian Leth; Hansen, Torben Mikael; Bøggild, Peter

    2002-01-01

    the conducting material either for a silicon wafer or a single probe unit. Using shadow masking photolithography an electrode spacing (pitch) down to 1.1 mum was obtained, with cantilever separation down to 200 run. Characterisation measurements have shown the microscopic probes to be mechanically very flexible......A method for fabricating microscopic four-point probes is presented. The method uses silicon-based microfabrication technology involving only two patterning steps. The last step in the fabrication process is an unmasked deposition of the conducting probe material, and it is thus possible to select...

  12. Comparative study of image contrast in scanning electron microscope and helium ion microscope.

    Science.gov (United States)

    O'Connell, R; Chen, Y; Zhang, H; Zhou, Y; Fox, D; Maguire, P; Wang, J J; Rodenburg, C

    2017-12-01

    Images of Ga+ -implanted amorphous silicon layers in a 110 n-type silicon substrate have been collected by a range of detectors in a scanning electron microscope and a helium ion microscope. The effects of the implantation dose and imaging parameters (beam energy, dwell time, etc.) on the image contrast were investigated. We demonstrate a similar relationship for both the helium ion microscope Everhart-Thornley and scanning electron microscope Inlens detectors between the contrast of the images and the Ga+ density and imaging parameters. These results also show that dynamic charging effects have a significant impact on the quantification of the helium ion microscope and scanning electron microscope contrast. © 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society.

  13. z calibration of the atomic force microscope by means of a pyramidal tip

    DEFF Research Database (Denmark)

    Jensen, Flemming

    1993-01-01

    A new method for imaging the probe tip of an atomic force microscope cantilever by the atomic force microscope itself (self-imaging) is presented. The self-imaging is accomplished by scanning the probe tip across a sharper tip on the surface. By using a pyramidal probe tip with a very well......-defined aspect ratio, this technique provides an excellent z-calibration standard for the atomic force microscope....

  14. Scanning electron microscopic evaluation of root canal surfaces ...

    African Journals Online (AJOL)

    2014-07-15

    50. How to cite this article: Hema BS, Chandu GS, Shiraguppi VL. Scanning electron microscopic evaluation of root canal surfaces prepared with three rotary endodontic systems: Lightspeed, ProTaper and EndoWave. Niger J.

  15. A confocal laser scanning microscopic study on thermoresponsive ...

    Indian Academy of Sciences (India)

    CdTe QDs composites using a fluorescence confocal laser scanning microscope. These composites have potential applications both in material science and biology. Keywords. Confocal ... of binary colloidal alloys and other soft matter systems.

  16. Resonant difference-frequency atomic force ultrasonic microscope

    Science.gov (United States)

    Cantrell, John H. (Inventor); Cantrell, Sean A. (Inventor)

    2010-01-01

    A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.

  17. Manipulation of magnetic skyrmions with a scanning tunneling microscope

    Science.gov (United States)

    Wieser, R.; Shindou, R.; Xie, X. C.

    2017-02-01

    The dynamics of a single magnetic skyrmion in an atomic spin system under the influence of a scanning tunneling microscope is investigated by computer simulations solving the Landau-Lifshitz-Gilbert equation. Two possible scenarios are described: manipulation with aid of a spin-polarized tunneling current and by an electric field created by the scanning tunneling microscope. The dynamics during the creation and annihilation process is studied and the possibility to move single skyrmions is showed.

  18. Atomic Force Microscope for Imaging and Spectroscopy

    Science.gov (United States)

    Pike, W. T.; Hecht, M. H.; Anderson, M. S.; Akiyama, T.; Gautsch, S.; deRooij, N. F.; Staufer, U.; Niedermann, Ph.; Howald, L.; Mueller, D.

    2000-01-01

    We have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.

  19. Scanning probe microscopes go video rate and beyond

    Science.gov (United States)

    Rost, M. J.; Crama, L.; Schakel, P.; van Tol, E.; van Velzen-Williams, G. B. E. M.; Overgauw, C. F.; ter Horst, H.; Dekker, H.; Okhuijsen, B.; Seynen, M.; Vijftigschild, A.; Han, P.; Katan, A. J.; Schoots, K.; Schumm, R.; van Loo, W.; Oosterkamp, T. H.; Frenken, J. W. M.

    2005-05-01

    In this article we introduce a, video-rate, control system that can be used with any type of scanning probe microscope, and that allows frame rates up to 200images/s. These electronics are capable of measuring in a fast, completely analog mode as well as in the more conventional digital mode. The latter allows measurements at low speeds and options, such as, e.g., atom manipulation, current-voltage spectroscopy, or force-distance curves. For scanning tunneling microscope (STM) application we implemented a hybrid mode between the well-known constant-height and constant-current modes. This hybrid mode not only increases the maximum speed at which the surface can be imaged, but also improves the resolution at lower speeds. Acceptable image quality at high speeds could only be obtained by pushing the performance of each individual part of the electronics to its limit: we developed a preamplifier with a bandwidth of 600kHz, a feedback electronics with a bandwidth of 1MHz, a home-built bus structure for the fast data transfer, fast analog to digital converters, and low-noise drivers. Future improvements and extensions to the control electronics can be realized easily and quickly, because of its open architecture with its modular plug-in units. In the second part of this article we show our high-speed results. The ultrahigh vacuum application of these control electronics on our (UHV)-STM enabled imaging speeds up to 0.3mm/s, while still obtaining atomic step resolution. At high frame rates, the images suffered from noticeable distortions, which we have been able to analyze by virtue of the unique access to the error (dZ) signal. The distortions have all been associated with mechanical resonances in the scan head of the UHV-STM. In order to reduce such resonance effects, we have designed and built a scan head with high resonance frequencies (⩾64kHz), especially for the purpose of testing the fast electronics. Using this scanner we have reached video-rate imaging speeds

  20. Dental Wear: A Scanning Electron Microscope Study

    Directory of Open Access Journals (Sweden)

    Luca Levrini

    2014-01-01

    Full Text Available Dental wear can be differentiated into different types on the basis of morphological and etiological factors. The present research was carried out on twelve extracted human teeth with dental wear (three teeth showing each type of wear: erosion, attrition, abrasion, and abfraction studied by scanning electron microscopy (SEM. The study aimed, through analysis of the macro- and micromorphological features of the lesions (considering the enamel, dentin, enamel prisms, dentinal tubules, and pulp, to clarify the different clinical and diagnostic presentations of dental wear and their possible significance. Our results, which confirm current knowledge, provide a complete overview of the distinctive morphology of each lesion type. It is important to identify the type of dental wear lesion in order to recognize the contributing etiological factors and, consequently, identify other more complex, nondental disorders (such as gastroesophageal reflux, eating disorders. It is clear that each type of lesion has a specific morphology and mechanism, and further clinical studies are needed to clarify the etiological processes, particularly those underlying the onset of abfraction.

  1. Wettability study using transmitted electrons in environmental scanning electron microscope

    Science.gov (United States)

    Barkay, Z.

    2010-05-01

    A method for quantitative wettability study at nanoscale is presented. It is based on measuring transmitted electrons through nanodroplets using wet scanning transmission electron microscope (wet-STEM) detector in environmental scanning electron microscope. The quantitative information of the nanodroplet shape and contact angle is obtained by fitting Monte Carlo simulation results for transmitted electrons through spherical cap geometry with the experimental wet-STEM results. The characterization is demonstrated for particles and for initial stages of water droplet condensation over a nonhomogeneous holey carbon grid. The method is suggested for application in thin polymer and biological films.

  2. Closed-Loop Autofocus Scheme for Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Cui Le

    2015-01-01

    Full Text Available In this paper, we present a full scale autofocus approach for scanning electron microscope (SEM. The optimal focus (in-focus position of the microscope is achieved by maximizing the image sharpness using a vision-based closed-loop control scheme. An iterative optimization algorithm has been designed using the sharpness score derived from image gradient information. The proposed method has been implemented and validated using a tungsten gun SEM at various experimental conditions like varying raster scan speed, magnification at real-time. We demonstrate that the proposed autofocus technique is accurate, robust and fast.

  3. Measuring voltage transients with an ultrafast scanning tunneling microscope

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1997-01-01

    We use an ultrafast scanning tunneling microscope to resolve propagating voltage transients in space and time. We demonstrate that the previously observed dependence of the transient signal amplitude on the tunneling resistance was only caused by the electrical sampling circuit. With a modified......-gating photoconductive switch with a rigidly attached fiber, the probe is scanned without changing the probe characteristics. (C) 1997 American Institute of Physics....

  4. High-speed force mapping on living cells with a small cantilever atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Braunsmann, Christoph; Seifert, Jan; Rheinlaender, Johannes; Schäffer, Tilman E., E-mail: Tilman.Schaeffer@uni-tuebingen [Institute of Applied Physics and LISA, University of Tübingen, Auf der Morgenstelle 10, 72076 Tübingen (Germany)

    2014-07-15

    The imaging speed of the wide-spread force mapping mode for quantitative mechanical measurements on soft samples in liquid with the atomic force microscope (AFM) is limited by the bandwidth of the z-scanner and viscous drag forces on the cantilever. Here, we applied high-speed, large scan-range atomic force microscopy and small cantilevers to increase the speed of force mapping by ≈10−100 times. This allowed resolving dynamic processes on living mouse embryonic fibroblasts. Cytoskeleton reorganization during cell locomotion, growth of individual cytoskeleton fibers, cell blebbing, and the formation of endocytic pits in the cell membrane were observed. Increasing the force curve rate from 2 to 300 Hz increased the measured apparent Young's modulus of the cells by about 10 times, which facilitated force mapping measurements at high speed.

  5. Modeling the hysteresis of a scanning probe microscope

    DEFF Research Database (Denmark)

    Dirscherl, Kai; Garnæs, Jørgen; Nielsen, L.

    2000-01-01

    Most scanning probe microscopes use piezoelectric actuators in open loop configurations. Therefore a major problem related to these instruments is the image distortion due to the hysteresis effect of the piezo. In order to eliminate the distortions, cost effective software control based on a model...

  6. Electric field effects in scanning tunneling microscope imaging

    DEFF Research Database (Denmark)

    Stokbro, Kurt; Quaade, Ulrich; Grey, Francois

    1998-01-01

    We present a high-voltage extension of the Tersoff-Hamann theory of scanning tunneling microscope (STM) images, which includes the effect of the electric field between the tip and the sample. The theoretical model is based on first-principles electronic structure calculations and has no adjustable...

  7. New Scanning Electron Microscope Used for Cryogenic Tensile Testing

    CERN Multimedia

    Maximilien Brice

    2013-01-01

    At CERN engineering department's installation for cryogenic tensile testing, the new scanning electron microscope (SEM) allows for detailed optical observations to be carried out. Using the SEM, surface coatings and tensile properties of materials can investigated in order to better understand how they behave under different conditions.

  8. Scanning electron microscopic evaluation of root canal surfaces ...

    African Journals Online (AJOL)

    Scanning electron microscopic evaluation of root canal surfaces prepared with three rotary endodontic systems: Lightspeed, ProTaper and EndoWave. ... presence or absence of debris and smear layer and the photographs were taken at coronal, middle and apical 1/3 with a magnification of ~200 and ~1000 respectively.

  9. Modular Scanning Confocal Microscope with Digital Image Processing.

    Science.gov (United States)

    Ye, Xianjun; McCluskey, Matthew D

    2016-01-01

    In conventional confocal microscopy, a physical pinhole is placed at the image plane prior to the detector to limit the observation volume. In this work, we present a modular design of a scanning confocal microscope which uses a CCD camera to replace the physical pinhole for materials science applications. Experimental scans were performed on a microscope resolution target, a semiconductor chip carrier, and a piece of etched silicon wafer. The data collected by the CCD were processed to yield images of the specimen. By selecting effective pixels in the recorded CCD images, a virtual pinhole is created. By analyzing the image moments of the imaging data, a lateral resolution enhancement is achieved by using a 20 × / NA = 0.4 microscope objective at 532 nm laser wavelength.

  10. Improved controlled atmosphere high temperature scanning probe microscope

    DEFF Research Database (Denmark)

    Hansen, Karin Vels; Wu, Yuehua; Jacobsen, Torben

    2013-01-01

    ) is monitored by an oxygen sensor. We present here some examples of its capabilities demonstrated by high temperature topography with simultaneously ac electrical conductance measurements during atmosphere changes, electrochemical impedance spectroscopy at various temperatures, and measurements of the surface......To locally access electrochemical active surfaces and interfaces in operando at the sub-micron scale at high temperatures in a reactive gas atmosphere is of great importance to understand the basic mechanisms in new functional materials, for instance, for energy technologies, such as solid oxide...... fuel cells and electrolyzer cells. Here, we report on advanced improvements of our original controlled atmosphere high temperature scanning probe microscope, CAHT-SPM. The new microscope can employ a broad range of the scanning probe techniques including tapping mode, scanning tunneling microscopy...

  11. Quantification of the lateral detachment force for bacterial cells using atomic force microscope and centrifugation

    Energy Technology Data Exchange (ETDEWEB)

    Zhang, Tong, E-mail: zhangt@hkucc.hku.hk [Environmental Biotechnology Laboratory, Department of Civil Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong (China); Chao, Yuanqing; Shih, Kaimin; Li, Xiao-Yan; Fang, Herbert H.P. [Environmental Biotechnology Laboratory, Department of Civil Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong (China)

    2011-01-15

    To determine the lateral detachment force for individual bacterial cells, a quantitative method using the contact mode of an atomic force microscope (AFM) was developed in this study. Three key factors for the proposed method, i.e. scan size, scan rate and cantilever choice, were evaluated and optimized. The scan size of 40x40 {mu}m{sup 2} was optimal for capturing sufficient number of adhered cells in a microscopic field and provide adequate information for cell identification and detachment force measurement. The scan rate affected the measurement results significantly, and was optimized at 40 {mu}m/s considering both force measurement accuracy and experimental efficiency. The hardness of applied cantilevers also influenced force determination. The proposed protocol for cantilever selection is to use those with the lowest spring constant first and then step up to a harder cantilever until all cells are detached. The lateral detachment force of Escherichia coli cells on polished stainless steel and a glass-slide coated with poly-L-lysine were measured as 0.763{+-}0.167 and 0.639{+-}0.136 nN, respectively. The results showed that the established method had good repeatability and sensitivity to various bacteria/substrata combinations. The detachment force quantified by AFM (0.639{+-}0.136 nN) was comparable to that measured by the centrifugation method (1.12 nN). -- Research highlights: {yields} A quantitative method via AFM is developed to measure the lateral detachment force of an attached cell. {yields} The parameters of AFM operation for this method are optimized. {yields} The tests using E. coli on different substrata show that the method has good repeatability and sensitivity. {yields} The method could obtain reliable results that are comparable to those using the centrifugation approach.

  12. The Scanning Theremin Microscope: A Model Scanning Probe Instrument for Hands-On Activities

    Science.gov (United States)

    Quardokus, Rebecca C.; Wasio, Natalie A.; Kandel, S. Alex

    2014-01-01

    A model scanning probe microscope, designed using similar principles of operation to research instruments, is described. Proximity sensing is done using a capacitance probe, and a mechanical linkage is used to scan this probe across surfaces. The signal is transduced as an audio tone using a heterodyne detection circuit analogous to that used in…

  13. Transmission environmental scanning electron microscope with scintillation gaseous detection device

    Energy Technology Data Exchange (ETDEWEB)

    Danilatos, Gerasimos, E-mail: gerry@danilatos.com [ESEM Research Laboratory, 28 Wallis Parade, North Bondi, NSW 2026 (Australia); Kollia, Mary [Laboratory of Electron Microscopy and Microanalysis, School of Natural Sciences, University of Patras, GR-26504 Patras (Greece); Dracopoulos, Vassileios [Foundation for Research & Technology-Hellas (FORTH), Institute of Chemical Engineering Sciences (ICE-HT), Stadiou Str., Platani P.O.Box 1414, GR-26504 Patras (Greece)

    2015-03-15

    A transmission environmental scanning electron microscope with use of a scintillation gaseous detection device has been implemented. This corresponds to a transmission scanning electron microscope but with addition of a gaseous environment acting both as environmental and detection medium. A commercial type of low vacuum machine has been employed together with appropriate modifications to the detection configuration. This involves controlled screening of various emitted signals in conjunction with a scintillation gaseous detection device already provided with the machine for regular surface imaging. Dark field and bright field imaging has been obtained along with other detection conditions. With a progressive series of modifications and tests, the theory and practice of a novel type of microscopy is briefly shown now ushering further significant improvements and developments in electron microscopy as a whole. - Highlights: • Novel scanning transmission electron microscopy (STEM) with an environmental scanning electron microscope (ESEM) called TESEM. • Use of the gaseous detection device (GDD) in scintillation mode that allows high resolution bright and dark field imaging in the TESEM. • Novel approach towards a unification of both vacuum and environmental conditions in both bulk/surface and transmission mode of electron microscopy.

  14. The Development of a Scanning Soft X-Ray Microscope.

    Science.gov (United States)

    Rarback, Harvey Miles

    We have developed a scanning soft X-ray microscope, which can be used to image natural biological specimens at high resolution and with less damage than electron microscopy. The microscope focuses a monochromatic beam of synchrotron radiation to a nearly diffraction limited spot with the aid of a high resolution Fresnel zone plate, specially fabricated for us at the IBM Watson Research Center. The specimen at one atmosphere is mechanically scanned through the spot and the transmitted radiation is efficiently detected with a flow proportional counter. A computer forms a realtime transmission image of the specimen which is displayed on a color monitor. Our first generation optics have produced images of natural wet specimens at a resolution of 300 nm.

  15. Spiral scanning method for atomic force microscopy.

    Science.gov (United States)

    Hung, Shao-Kang

    2010-07-01

    A spiral scanning method is proposed for atomic force microscopy with thoroughgoing analysis and implementation. Comparing with the traditional line-by-line scanning method, the spiral scanning method demonstrates higher imaging speed, minor image distortion, and lower acceleration, which can damage the piezoelectric scanner. Employing the spiral scanning method to replace the line-by-line scanning method, the experiment shows that the time to complete an imaging cycle can be reduced from 800 s to 314 s without sacrificing the image resolution.

  16. Experiments on terahertz 3D scanning microscopic imaging

    Science.gov (United States)

    Zhou, Yi; Li, Qi

    2016-10-01

    Compared with the visible light and infrared, terahertz (THz) radiation can penetrate nonpolar and nonmetallic materials. There are many studies on the THz coaxial transmission confocal microscopy currently. But few researches on the THz dual-axis reflective confocal microscopy were reported. In this paper, we utilized a dual-axis reflective confocal scanning microscope working at 2.52 THz. In contrast with the THz coaxial transmission confocal microscope, the microscope adopted in this paper can attain higher axial resolution at the expense of reduced lateral resolution, revealing more satisfying 3D imaging capability. Objects such as Chinese characters "Zhong-Hua" written in paper with a pencil and a combined sheet metal which has three layers were scanned. The experimental results indicate that the system can extract two Chinese characters "Zhong," "Hua" or three layers of the combined sheet metal. It can be predicted that the microscope can be applied to biology, medicine and other fields in the future due to its favorable 3D imaging capability.

  17. Black hairy tongue. A scanning electron microscopic study.

    Science.gov (United States)

    Harada, Y; Gaafar, H

    1977-01-01

    A patient with tongue malignancy associated with a black hairy tongue is presented. Specimens from e area fo the black hairy tongue and from a normally appearing part were studied with the scanning electron microscope. The "hairs" consisted of elongated filiform papillae due to accumulated keratinized layers. In-between these layers, fungi and bacteria were found. The aetiology of the blck hairy tongue in this patient is discussed.

  18. A New Multichannel Spectral Imaging Laser Scanning Confocal Microscope

    Directory of Open Access Journals (Sweden)

    Yunhai Zhang

    2013-01-01

    Full Text Available We have developed a new multichannel spectral imaging laser scanning confocal microscope for effective detection of multiple fluorescent labeling in the research of biological tissues. In this paper, the design and key technologies of the system are introduced. Representative results on confocal imaging, 3-dimensional sectioning imaging, and spectral imaging are demonstrated. The results indicated that the system is applicable to multiple fluorescent labeling in biological experiments.

  19. Microscopic FMR Using Magnetic Resonance Force Microscopy

    Science.gov (United States)

    Zhang, Z.; Hammel, P. C.; Wigen, P. E.

    1996-03-01

    Magnetic resonance force microscopy (MRFM) is a new 3-D imaging technique with ultra-high spatial resolution. This technique, discussed primarily in the context of nuclear magnetic resonance, can also be applied as a microscopic ferromagnetic resonance probe to investigate the distributions of magnetic anisotropy and magnetic exchange interactions within magnetic materials (for example, magnetic multilayer systems). We report the first MRFM experiment on a single crystal Yittrium Iron Garnet film. A non-resonance mode and a family of magneto-static modes were observed in the MRFM spectra. The non-resonance mode is due to the response of the sample magnetization to the applied, time dependent bias field. This will be the main noise source when a magnet is mounted on the cantilever, an arrangement which is necessary in order to perform 3-D imaging in MRFM. The behavior of the magneto-static modes is in qualitative accord with theoretical expectations. The MRFM signal intensity is so large that the experiment is performed under ambient pressure instead of vacuum to reduce the response of the detector (cantilever). This indicates that MRFM will allow micron or sub-micron spatial resolution in studies of a wide variety of magnetic materials.

  20. Polymerized LB Films Imaged with a Combined Atomic Force Microscope-Fluorescence Microscope

    NARCIS (Netherlands)

    Putman, C.A.J.; Putman, Constant A.J.; Hansma, Helen G.; Gaub, Hermann E.; Hansma, Paul K.

    1992-01-01

    The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined

  1. Interlaboratory comparison of traceable atomic force microscope pitch measurements

    Science.gov (United States)

    Dixson, Ronald; Chernoff, Donald A.; Wang, Shihua; Vorburger, Theodore V.; Tan, Siew Leng; Orji, Ndubuisi G.; Fu, Joseph

    2010-06-01

    The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have completed a three-way interlaboratory comparison of traceable pitch measurements using atomic force microscopy (AFM). The specimen being used for this comparison is provided by ASM and consists of SiO2 lines having a 70 nm pitch patterned on a silicon substrate. NIST has a multifaceted program in atomic force microscope (AFM) dimensional metrology. One component of this effort is a custom in-house metrology AFM, called the calibrated AFM (C-AFM). The NIST C-AFM has displacement metrology for all three axes traceable to the 633 nm wavelength of the iodine-stabilized He-Ne laser - a recommended wavelength for realization of the SI (Système International d'Unités, or International System of Units) meter. NIST used the C-AFM to participate in this comparison. ASM used a commercially available AFM with an open-loop scanner, calibrated by a 144 nm pitch transfer standard. In a prior collaboration with Physikalisch-Technische Bundesanstalt (PTB), the German national metrology institute, ASM's transfer standard was calibrated using PTB's traceable optical diffractometry instrument. Thus, ASM's measurements are also traceable to the SI meter. NMC/A*STAR used a large scanning range metrological atomic force microscope (LRM-AFM). The LRM-AFM integrates an AFM scanning head into a nano-stage equipped with three built-in He-Ne laser interferometers so that its measurement related to the motion on all three axes is directly traceable to the SI meter. The measurements for this interlaboratory comparison have been completed and the results are in agreement within their expanded uncertainties and at the level of a few parts in 104.

  2. Manipulation of nanoparticles of different shapes inside a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Boris Polyakov

    2014-02-01

    Full Text Available In this work polyhedron-like gold and sphere-like silver nanoparticles (NPs were manipulated on an oxidized Si substrate to study the dependence of the static friction and the contact area on the particle geometry. Measurements were performed inside a scanning electron microscope (SEM that was equipped with a high-precision XYZ-nanomanipulator. To register the occurring forces a quartz tuning fork (QTF with a glued sharp probe was used. Contact areas and static friction forces were calculated by using different models and compared with the experimentally measured force. The effect of NP morphology on the nanoscale friction is discussed.

  3. Analytical scanning evanescent microwave microscope and control stage

    Science.gov (United States)

    Xiang, Xiao-Dong; Gao, Chen; Duewer, Fred; Yang, Hai Tao; Lu, Yalin

    2009-06-23

    A scanning evanescent microwave microscope (SEMM) that uses near-field evanescent electromagnetic waves to probe sample properties is disclosed. The SEMM is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The SEMM has the ability to map dielectric constant, loss tangent, conductivity, electrical impedance, and other electrical parameters of materials. Such properties are then used to provide distance control over a wide range, from to microns to nanometers, over dielectric and conductive samples for a scanned evanescent microwave probe, which enable quantitative non-contact and submicron spatial resolution topographic and electrical impedance profiling of dielectric, nonlinear dielectric and conductive materials. The invention also allows quantitative estimation of microwave impedance using signals obtained by the scanned evanescent microwave probe and quasistatic approximation modeling. The SEMM can be used to measure electrical properties of both dielectric and electrically conducting materials.

  4. Scanning optical microscope with long working distance objective

    Science.gov (United States)

    Cloutier, Sylvain G.

    2010-10-19

    A scanning optical microscope, including: a light source to generate a beam of probe light; collimation optics to substantially collimate the probe beam; a probe-result beamsplitter; a long working-distance, infinity-corrected objective; scanning means to scan a beam spot of the focused probe beam on or within a sample; relay optics; and a detector. The collimation optics are disposed in the probe beam. The probe-result beamsplitter is arranged in the optical paths of the probe beam and the resultant light from the sample. The beamsplitter reflects the probe beam into the objective and transmits resultant light. The long working-distance, infinity-corrected objective is also arranged in the optical paths of the probe beam and the resultant light. It focuses the reflected probe beam onto the sample, and collects and substantially collimates the resultant light. The relay optics are arranged to relay the transmitted resultant light from the beamsplitter to the detector.

  5. Pupil engineering for a confocal reflectance line-scanning microscope

    Science.gov (United States)

    Patel, Yogesh G.; Rajadhyaksha, Milind; DiMarzio, Charles A.

    2011-03-01

    Confocal reflectance microscopy may enable screening and diagnosis of skin cancers noninvasively and in real-time, as an adjunct to biopsy and pathology. Current confocal point-scanning systems are large, complex, and expensive. A confocal line-scanning microscope, utilizing a of linear array detector can be simpler, smaller, less expensive, and may accelerate the translation of confocal microscopy in clinical and surgical dermatology. A line scanner may be implemented with a divided-pupil, half used for transmission and half for detection, or with a full-pupil using a beamsplitter. The premise is that a confocal line-scanner with either a divided-pupil or a full-pupil will provide high resolution and optical sectioning that would be competitive to that of the standard confocal point-scanner. We have developed a confocal line-scanner that combines both divided-pupil and full-pupil configurations. This combined-pupil prototype is being evaluated to determine the advantages and limitations of each configuration for imaging skin, and comparison of performance to that of commercially available standard confocal point-scanning microscopes. With the combined configuration, experimental evaluation of line spread functions (LSFs), contrast, signal-to-noise ratio, and imaging performance is in progress under identical optical and skin conditions. Experimental comparisons between divided-pupil and full-pupil LSFs will be used to determine imaging performance. Both results will be compared to theoretical calculations using our previously reported Fourier analysis model and to the confocal point spread function (PSF). These results may lead to a simpler class of confocal reflectance scanning microscopes for clinical and surgical dermatology.

  6. High-speed atomic force microscope combined with single-molecule fluorescence microscope.

    Science.gov (United States)

    Fukuda, Shingo; Uchihashi, Takayuki; Iino, Ryota; Okazaki, Yasutaka; Yoshida, Masato; Igarashi, Kiyohiko; Ando, Toshio

    2013-07-01

    High-speed atomic force microscopy (HS-AFM) and total internal reflection fluorescence microscopy (TIRFM) have mutually complementary capabilities. Here, we report techniques to combine these microscopy systems so that both microscopy capabilities can be simultaneously used in the full extent. To combine the two systems, we have developed a tip-scan type HS-AFM instrument equipped with a device by which the laser beam from the optical lever detector can track the cantilever motion in the X- and Y-directions. This stand-alone HS-AFM system is mounted on an inverted optical microscope stage with a wide-area scanner. The capability of this combined system is demonstrated by simultaneous HS-AFM∕TIRFM imaging of chitinase A moving on a chitin crystalline fiber and myosin V walking on an actin filament.

  7. Simulation of scanning transmission electron microscope images on desktop computers

    Energy Technology Data Exchange (ETDEWEB)

    Dwyer, C., E-mail: christian.dwyer@mcem.monash.edu.au [Monash Centre for Electron Microscopy, Department of Materials Engineering, Monash University, Victoria 3800 (Australia)

    2010-02-15

    Two independent strategies are presented for reducing the computation time of multislice simulations of scanning transmission electron microscope (STEM) images: (1) optimal probe sampling, and (2) the use of desktop graphics processing units. The first strategy is applicable to STEM images generated by elastic and/or inelastic scattering, and requires minimal effort for its implementation. Used together, these two strategies can reduce typical computation times from days to hours, allowing practical simulation of STEM images of general atomic structures on a desktop computer.

  8. [Enamel bundles and lamellae under the scanning electron microscope].

    Science.gov (United States)

    Bures, H; Svejda, J

    1976-01-01

    Lamellae, tufts and cracks were found in the enamel near the dentionenamel junction. When investigated by the scanning electron microscop, lamellae and tufts were very similar to each other as to their structure. Lamellae appeared in two kinds: 1. Organic material originating in the dentionenamel membrane filled the whole space. 2. The space was empty, yet an organic membrane was covering the walls of adjacent prisms. Tufts and lamellae differed merely in their lenght. The walls of the cracks lacked organic material, the prisms being damaged or their course interrupted.

  9. Characteristics of different frequency ranges in scanning electron microscope images

    Energy Technology Data Exchange (ETDEWEB)

    Sim, K. S., E-mail: kssim@mmu.edu.my; Nia, M. E.; Tan, T. L.; Tso, C. P.; Ee, C. S. [Faculty of Engineering and Technology, Multimedia University, 75450 Melaka (Malaysia)

    2015-07-22

    We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement.

  10. Adaptive noise Wiener filter for scanning electron microscope imaging system.

    Science.gov (United States)

    Sim, K S; Teh, V; Nia, M E

    2016-01-01

    Noise on scanning electron microscope (SEM) images is studied. Gaussian noise is the most common type of noise in SEM image. We developed a new noise reduction filter based on the Wiener filter. We compared the performance of this new filter namely adaptive noise Wiener (ANW) filter, with four common existing filters as well as average filter, median filter, Gaussian smoothing filter and the Wiener filter. Based on the experiments results the proposed new filter has better performance on different noise variance comparing to the other existing noise removal filters in the experiments. © Wiley Periodicals, Inc.

  11. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans

    Directory of Open Access Journals (Sweden)

    Xu Chen

    2017-01-01

    Full Text Available A new scan-head structure for the scanning tunneling microscope (STM is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for XY scans coaxially housed in a piezoelectric tube with single inner and outer electrodes (for Z scan. They are fixed at one end (called common end. A hollow tantalum shaft is coaxially housed in the XY-scan tube and they are mutually fixed at both ends. When the XY scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled XY and Z scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.

  12. A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled XY and Z Scans.

    Science.gov (United States)

    Chen, Xu; Guo, Tengfei; Hou, Yubin; Zhang, Jing; Meng, Wenjie; Lu, Qingyou

    2017-01-01

    A new scan-head structure for the scanning tunneling microscope (STM) is proposed, featuring high scan precision and rigidity. The core structure consists of a piezoelectric tube scanner of quadrant type (for XY scans) coaxially housed in a piezoelectric tube with single inner and outer electrodes (for Z scan). They are fixed at one end (called common end). A hollow tantalum shaft is coaxially housed in the XY-scan tube and they are mutually fixed at both ends. When the XY scanner scans, its free end will bring the shaft to scan and the tip which is coaxially inserted in the shaft at the common end will scan a smaller area if the tip protrudes short enough from the common end. The decoupled XY and Z scans are desired for less image distortion and the mechanically reduced scan range has the superiority of reducing the impact of the background electronic noise on the scanner and enhancing the tip positioning precision. High quality atomic resolution images are also shown.

  13. Simulation of channeling contrast in scanning ion microscope images

    Science.gov (United States)

    Ohya, Kaoru

    2018-01-01

    The scanning ion microscope (SIM) provides a distinct channeling contrast in backscattered ion (BSI) and secondary electron (SE) images owing to its wide critical angle for ion channeling. In this report, we present a molecular dynamics (MD) simulation of a crystalline sample's channeling contrast that has been scanned by ion beams of 30 keV He, Ne, and Ga in the SIM. A middle portion of the sample surface inclined at different angles against neighboring sides oriented toward the ions' channeling direction. Line profiles of the BSI and SE yields along the surface reproduced crystalline-oriented changes that are expected for a transparency model. Nevertheless, a trajectory simulation of the ions in the sample according to the MD technique suggests some contrast differences from that of the model for the BSI and SE images and for different ion species.

  14. Structural examination of lithium niobate ferroelectric crystals by combining scanning electron microscopy and atomic force microscopy

    Science.gov (United States)

    Efremova, P. V.; Ped'ko, B. B.; Kuznecova, Yu. V.

    2016-02-01

    The structure of lithium niobate single crystals is studied by a complex technique that combines scanning electron microscopy and atomic force microscopy. By implementing the piezoresponse force method on an atomic force microscope, the domain structure of lithium niobate crystals, which was not revealed without electron beam irradiation, is visualized

  15. Microsphere-based super-resolution scanning optical microscope.

    Science.gov (United States)

    Huszka, Gergely; Yang, Hui; Gijs, Martin A M

    2017-06-26

    High-refractive index dielectric microspheres positioned within the field of view of a microscope objective in a dielectric medium can focus the light into a so-called photonic nanojet. A sample placed in such nanojet can be imaged by the objective with super-resolution, i.e. with a resolution beyond the classical diffraction limit. However, when imaging nanostructures on a substrate, the propagation distance of a light wave in the dielectric medium in between the substrate and the microsphere must be small enough to reveal the sample's nanometric features. Therefore, only the central part of an image obtained through a microsphere shows super-resolution details, which are typically ∼100 nm using white light (peak at λ = 600 nm). We have performed finite element simulations of the role of this critical distance in the super-resolution effect. Super-resolution imaging of a sample placed beneath the microsphere is only possible within a very restricted central area of ∼10 μm2, where the separation distance between the substrate and the microsphere surface is very small (∼1 μm). To generate super-resolution images over larger areas of the sample, we have fixed a microsphere on a frame attached to the microscope objective, which is automatically scanned over the sample in a step-by-step fashion. This generates a set of image tiles, which are subsequently stitched into a single super-resolution image (with resolution of λ/4-λ/5) of a sample area of up to ∼104 μm2. Scanning a standard optical microscope objective with microsphere therefore enables super-resolution microscopy over the complete field-of-view of the objective.

  16. Postprocessing Algorithm for Driving Conventional Scanning Tunneling Microscope at Fast Scan Rates

    Directory of Open Access Journals (Sweden)

    Hao Zhang

    2017-01-01

    Full Text Available We present an image postprocessing framework for Scanning Tunneling Microscope (STM to reduce the strong spurious oscillations and scan line noise at fast scan rates and preserve the features, allowing an order of magnitude increase in the scan rate without upgrading the hardware. The proposed method consists of two steps for large scale images and four steps for atomic scale images. For large scale images, we first apply for each line an image registration method to align the forward and backward scans of the same line. In the second step we apply a “rubber band” model which is solved by a novel Constrained Adaptive and Iterative Filtering Algorithm (CIAFA. The numerical results on measurement from copper(111 surface indicate the processed images are comparable in accuracy to data obtained with a slow scan rate, but are free of the scan drift error commonly seen in slow scan data. For atomic scale images, an additional first step to remove line-by-line strong background fluctuations and a fourth step of replacing the postprocessed image by its ranking map as the final atomic resolution image are required. The resulting image restores the lattice image that is nearly undetectable in the original fast scan data.

  17. Development of a scanning nanopipette probe microscope for fine processing using atmospheric pressure plasma jet

    Science.gov (United States)

    Morimatsu, Daisuke; Sugimoto, Hiromitsu; Nakamura, Atsushi; Ogino, Akihisa; Nagatsu, Masaaki; Iwata, Futoshi

    2016-08-01

    We developed a novel technique for fine material processing based on a localized atmospheric-pressure plasma jet (APPJ) using a scanning probe microscope equipped with a nanopipette. Using a nanopipette — a tapered glass capillary with an aperture of sub-micrometer diameter — as a nozzle makes it possible to localize the discharge area of the APPJ for fine surface processing. The nanopipette can also be used as a probe for a scanning probe microscope operated with shear-force feedback control, which is capable of positioning the pipette edge in the vicinity of material surfaces for APPJ processing and imaging of the processed surface. Sub-micrometer holes and line patterns were successfully processed on a photoresist film. It was possible to control the size of the processed patterns by varying the applied pulse voltage and the distance between the pipette and the surface.

  18. Lagrange time delay estimation for scanning electron microscope image magnification.

    Science.gov (United States)

    Sim, K-S; Thong, L W; Ting, H Y; Tso, C P

    2010-02-01

    Interpolation techniques that are used for image magnification to obtain more useful details of the surface such as morphology and mechanical contrast usually rely on the signal information distributed around edges and areas of sharp changes and these signal information can also be used to predict missing details from the sample image. However, many of these interpolation methods tend to smooth or blur out image details around the edges. In the present study, a Lagrange time delay estimation interpolator method is proposed and this method only requires a small filter order and has no noticeable estimation bias. Comparing results with the original scanning electron microscope magnification and results of various other interpolation methods, the Lagrange time delay estimation interpolator is found to be more efficient, more robust and easier to execute.

  19. A high stability and repeatability electrochemical scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Xia, Zhigang; Wang, Jihao; Lu, Qingyou, E-mail: qxl@ustc.edu.cn [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China); Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China); Hou, Yubin [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China)

    2014-12-15

    We present a home built electrochemical scanning tunneling microscope (ECSTM) with very high stability and repeatability. Its coarse approach is driven by a closely stacked piezo motor of GeckoDrive type with four rigid clamping points, which enhances the rigidity, compactness, and stability greatly. It can give high clarity atomic resolution images without sound and vibration isolations. Its drifting rates in XY and Z directions in solution are as low as 84 pm/min and 59 pm/min, respectively. In addition, repeatable coarse approaches in solution within 2 mm travel distance show a lateral deviation less than 50 nm. The gas environment can be well controlled to lower the evaporation rate of the cell, thus reducing the contamination and elongating the measurement time. Atomically resolved SO{sub 4}{sup 2−} image on Au (111) work electrode is demonstrated to show the performance of the ECSTM.

  20. Trichomes of Cannabis sativa as viewed with scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ledbetter, M.C.; Krikorian, A.D.

    1975-06-01

    Direct examination of fresh, unfixed and uncoated specimens from vegetative and floral parts of Cannabis sativa with the scanning electron microscope enables one to obtain a faithful representation of their surface morphology. The presence of two major types of trichomes has been confirmed: a glandular type comprising or terminating in a globoid structure, and a conically-shaped nonglandular type. Moreover, three or possibly four distinct glandular types can be distinguished: sessile globoid, small-stalked and large-stalked globoid, and a peltate type. The nonglandular trichomes can be distinguished by the nature of their surfaces: those with a warty surface, and those which are relatively smooth. The range of size and distribution, and the special features of all these types of trichomes are also provided.

  1. [Scanning electron microscopic study on newborn middle ear mucosa].

    Science.gov (United States)

    Li, Y

    1992-01-01

    Scanning electron microscopic studies were made on the mucosa of newborn middle ear. The results were: 1. The epithelial surface was found to contain four types of cell: the ciliated cell, the nonciliated cell without secretory granules (SG), the nonciliated cell with secretory granules (SG) and the flat cell. 2. The ciliated cell population appeared in the following order (from dense to sparse): eustachian tube, hypotympanum, antetympanum, epitympanum, promontory and post-tympanum. 3. The density of nonciliated cell without SG population was gradually increasing from anterior to posterior part of middle ear. 4. The population of nonciliated cell with SG was fewer and they were always found near the ciliated cells. 5. The flat cells were only seen on the flaccid part of tympanic membrane. This paper suggests that the ciliary system is basically mature and the development of mucus secreting members still is not perfect in newborn middle ear mucosa.

  2. Scanning tunneling microscope with continuous flow cryostat sample cooling

    Energy Technology Data Exchange (ETDEWEB)

    Behler, S.; Rose, M.K.; Dunphy, J.C.; Ogletree, D.F.; Salmeron, M. [Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States); Chapelier, C. [Departement de Recherche Fondamentale sur la Matiere Condensee, CEA/Grenoble, 38054 Grenoble Cedex 9 (France)

    1997-06-01

    We have constructed an ultrahigh vacuum scanning tunneling microscope (STM) for operation in the temperature range 20{endash}300 K. The design consists of a vibration isolated sample holder mounted on a continuous flow cryostat. By rotation and linear motion of the cryostat, the sample can be positioned in front of various surface preparation and analysis instruments contained in a single vacuum chamber. A lightweight beetle-type STM head is lowered from the top onto the sample by a linear manipulator. To minimize helium convection in the cryostat, the entire vacuum system, including a liquid helium storage Dewar, can be tilted by a few degrees perpendicular to the cryostat axis, which improves the operation. The performance of the instrument is demonstrated by atomically resolved images of the Pd(111) surface and adsorbed CO molecules. {copyright} {ital 1997 American Institute of Physics.}

  3. High-speed Lissajous-scan atomic force microscopy: Scan pattern planning and control design issues

    Science.gov (United States)

    Bazaei, A.; Yong, Yuen K.; Moheimani, S. O. Reza

    2012-06-01

    Tracking of triangular or sawtooth waveforms is a major difficulty for achieving high-speed operation in many scanning applications such as scanning probe microscopy. Such non-smooth waveforms contain high order harmonics of the scan frequency that can excite mechanical resonant modes of the positioning system, limiting the scan range and bandwidth. Hence, fast raster scanning often leads to image distortion. This paper proposes analysis and design methodologies for a nonlinear and smooth closed curve, known as Lissajous pattern, which allows much faster operations compared to the ordinary scan patterns. A simple closed-form measure is formulated for the image resolution of the Lissajous pattern. This enables us to systematically determine the scan parameters. Using internal model controllers (IMC), this non-raster scan method is implemented on a commercial atomic force microscope driven by a low resonance frequency positioning stage. To reduce the tracking errors due to actuator nonlinearities, higher order harmonic oscillators are included in the IMC controllers. This results in significant improvement compared to the traditional IMC method. It is shown that the proposed IMC controller achieves much better tracking performances compared to integral controllers when the noise rejection performances is a concern.

  4. A metrological large range atomic force microscope with improved performance.

    Science.gov (United States)

    Dai, Gaoliang; Wolff, Helmut; Pohlenz, Frank; Danzebrink, Hans-Ulrich

    2009-04-01

    A metrological large range atomic force microscope (Met. LR-AFM) has been set up and improved over the past years at Physikalisch-Technische Bundesanstalt (PTB). Being designed as a scanning sample type instrument, the sample is moved in three dimensions by a mechanical ball bearing stage in combination with a compact z-piezostage. Its topography is detected by a position-stationary AFM head. The sample displacement is measured by three embedded miniature homodyne interferometers in the x, y, and z directions. The AFM head is aligned in such a way that its cantilever tip is positioned on the sample surface at the intersection point of the three interferometer measurement beams for satisfying the Abbe measurement principle. In this paper, further improvements of the Met. LR-AFM are reported. A new AFM head using the beam deflection principle has been developed to reduce the influence of parasitic optical interference phenomena. Furthermore, an off-line Heydemann correction method has been applied to reduce the inherent interferometer nonlinearities to less than 0.3 nm (p-v). Versatile scanning functions, for example, radial scanning or local AFM measurement functions, have been implemented to optimize the measurement process. The measurement software is also improved and allows comfortable operations of the instrument via graphical user interface or script-based command sets. The improved Met. LR-AFM is capable of measuring, for instance, the step height, lateral pitch, line width, nanoroughness, and other geometrical parameters of nanostructures. Calibration results of a one-dimensional grating and a set of film thickness standards are demonstrated, showing the excellent metrological performance of the instrument.

  5. Standard practice for scanning electron microscope beam Size characterization

    CERN Document Server

    American Society for Testing and Materials. Philadelphia

    2004-01-01

    1.1 This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction. However, the resolution for any set of conditions is limited by the size of the electron beam. This size can be quantified through the measurement of an effective apparent edge sharpness for a number of materials, two of which are suggested. This practice requires an SEM with the capability to perform line-scan traces, for example, Y-deflection waveform generation, for the suggested materials. The range of SEM magnification at which this practice is of utility is from 1000 to 50 000 × . Higher magnifications may be attempted, but difficulty in making precise measurements can be expected. 1.2 This standard does not purport to address all of the safety concerns, if any, ass...

  6. Simulation and Characterization of a Miniaturized Scanning Electron Microscope

    Science.gov (United States)

    Gaskin, Jessica A.; Jerman, Gregory A.; Medley, Stephanie; Gregory, Don; Abbott, Terry O.; Sampson, Allen R.

    2011-01-01

    A miniaturized Scanning Electron Microscope (mSEM) for in-situ lunar investigations is being developed at NASA Marshall Space Flight Center with colleagues from the University of Alabama in Huntsville (UAH), Advanced Research Systems (ARS), the University of Tennessee in Knoxville (UTK) and Case Western Reserve University (CWRU). This effort focuses on the characterization of individual components of the mSEM and simulation of the complete system. SEMs can provide information on the size, shape, morphology and chemical composition of lunar regolith. Understanding these basic properties will allow us to better estimate the challenges associated with In-Situ Resource Utilization and to improve our basic science knowledge of the lunar surface (either precluding the need for sample return or allowing differentiation of unique samples to be returned to Earth.) The main components of the mSEM prototype includes: a cold field emission electron gun (CFEG), focusing lens, deflection/scanning system and backscatter electron detector. Of these, the electron gun development is of particular importance as it dictates much of the design of the remaining components. A CFEG was chosen for use with the lunar mSEM as its emission does not depend on heating of the tungsten emitter (lower power), it offers a long operation lifetime, is orders of magnitude brighter than tungsten hairpin guns, has a small source size and exhibits low beam energy spread.

  7. Microscopic derivation of electromagnetic force density in magnetic dielectric media

    NARCIS (Netherlands)

    Shevchenko, A.; Hoenders, B. J.

    2010-01-01

    Macroscopic force density imposed on a linear isotropic magnetic dielectric medium by an arbitrary electromagnetic field is derived by spatially averaging the microscopic Lorentz force density. The obtained expression differs from the commonly used expressions, but the energy-momentum tensor derived

  8. Interatomic force microscope and sample observing method therefor

    OpenAIRE

    YAMANAKA, K; Kolosov, Oleg; Ogiso, H; Sato, H.; Koda, T

    1994-01-01

    PURPOSE:To provide a measuring technology for interatomic microscope in which the irregular sample can be separated well from the frictional force. SOLUTION :An oscillating force applied laterally relatively between a sample 8 and a probe 4 Is provided. The sample 8 tilted laterally to excite bending orthogonal oscillation. The phase and the amplitude of the oscillation of the cantilever are detected.

  9. Miniaturized Environmental Scanning Electron Microscope for In Situ Planetary Studies

    Science.gov (United States)

    Gaskin, Jessica; Abbott, Terry; Medley, Stephanie; Gregory, Don; Thaisen, Kevin; Taylor , Lawrence; Ramsey, Brian; Jerman, Gregory; Sampson, Allen; Harvey, Ralph

    2010-01-01

    The exploration of remote planetary surfaces calls for the advancement of low power, highly-miniaturized instrumentation. Instruments of this nature that are capable of multiple types of analyses will prove to be particularly useful as we prepare for human return to the moon, and as we continue to explore increasingly remote locations in our Solar System. To this end, our group has been developing a miniaturized Environmental-Scanning Electron Microscope (mESEM) capable of remote investigations of mineralogical samples through in-situ topographical and chemical analysis on a fine scale. The functioning of an SEM is well known: an electron beam is focused to nanometer-scale onto a given sample where resulting emissions such as backscattered and secondary electrons, X-rays, and visible light are registered. Raster scanning the primary electron beam across the sample then gives a fine-scale image of the surface topography (texture), crystalline structure and orientation, with accompanying elemental composition. The flexibility in the types of measurements the mESEM is capable of, makes it ideally suited for a variety of applications. The mESEM is appropriate for use on multiple planetary surfaces, and for a variety of mission goals (from science to non-destructive analysis to ISRU). We will identify potential applications and range of potential uses related to planetary exploration. Over the past few of years we have initiated fabrication and testing of a proof-of-concept assembly, consisting of a cold-field-emission electron gun and custom high-voltage power supply, electrostatic electron-beam focusing column, and scanning-imaging electronics plus backscatter detector. Current project status will be discussed. This effort is funded through the NASA Research Opportunities in Space and Earth Sciences - Planetary Instrument Definition and Development Program.

  10. Computer-Controlled 3D Laser Scanning Microscope Based On Optical Disk Technology.

    Science.gov (United States)

    Schweizer, P.; Neveux, L.; Chiaramello, M.; Monteil, P.; Ostrowsky, D. B...

    1987-08-01

    We describe RASCALS* (RAster SCAn Laser System) a 2D and 3D scanning laser microscope and outline it's performance. This system, based on optical disk technology and a PC compatible computer offers an interesting cost/performance ratio compared to existing laser scanning microscopes.

  11. Scanning electron microscope automatic defect classification of process induced defects

    Science.gov (United States)

    Wolfe, Scott; McGarvey, Steve

    2017-03-01

    With the integration of high speed Scanning Electron Microscope (SEM) based Automated Defect Redetection (ADR) in both high volume semiconductor manufacturing and Research and Development (R and D), the need for reliable SEM Automated Defect Classification (ADC) has grown tremendously in the past few years. In many high volume manufacturing facilities and R and D operations, defect inspection is performed on EBeam (EB), Bright Field (BF) or Dark Field (DF) defect inspection equipment. A comma separated value (CSV) file is created by both the patterned and non-patterned defect inspection tools. The defect inspection result file contains a list of the inspection anomalies detected during the inspection tools' examination of each structure, or the examination of an entire wafers surface for non-patterned applications. This file is imported into the Defect Review Scanning Electron Microscope (DRSEM). Following the defect inspection result file import, the DRSEM automatically moves the wafer to each defect coordinate and performs ADR. During ADR the DRSEM operates in a reference mode, capturing a SEM image at the exact position of the anomalies coordinates and capturing a SEM image of a reference location in the center of the wafer. A Defect reference image is created based on the Reference image minus the Defect image. The exact coordinates of the defect is calculated based on the calculated defect position and the anomalies stage coordinate calculated when the high magnification SEM defect image is captured. The captured SEM image is processed through either DRSEM ADC binning, exporting to a Yield Analysis System (YAS), or a combination of both. Process Engineers, Yield Analysis Engineers or Failure Analysis Engineers will manually review the captured images to insure that either the YAS defect binning is accurately classifying the defects or that the DRSEM defect binning is accurately classifying the defects. This paper is an exploration of the feasibility of the

  12. A Compact Vertical Scanner for Atomic Force Microscopes

    OpenAIRE

    Jae Hong Park; Jaesool Shim; Dong-Yeon Lee

    2010-01-01

    A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, an...

  13. Chemical Phenomena of Atomic Force Microscopy Scanning.

    Science.gov (United States)

    Ievlev, Anton V; Brown, Chance; Burch, Matthew J; Agar, Joshua C; Velarde, Gabriel A; Martin, Lane W; Maksymovych, Petro; Kalinin, Sergei V; Ovchinnikova, Olga S

    2018-02-12

    Atomic force microscopy is widely used for nanoscale characterization of materials by scientists worldwide. The long-held belief of ambient AFM is that the tip is generally chemically inert but can be functionalized with respect to the studied sample. This implies that basic imaging and scanning procedures do not affect surface and bulk chemistry of the studied sample. However, an in-depth study of the confined chemical processes taking place at the tip-surface junction and the associated chemical changes to the material surface have been missing as of now. Here, we used a hybrid system that combines time-of-flight secondary ion mass spectrometry with an atomic force microscopy to investigate the chemical interactions that take place at the tip-surface junction. Investigations showed that even basic contact mode AFM scanning is able to modify the surface of the studied sample. In particular, we found that the silicone oils deposited from the AFM tip into the scanned regions and spread to distances exceeding 15 μm from the tip. These oils were determined to come from standard gel boxes used for the storage of the tips. The explored phenomena are important for interpreting and understanding results of AFM mechanical and electrical studies relying on the state of the tip-surface junction.

  14. Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope

    Directory of Open Access Journals (Sweden)

    Sadegh Mehdi Aghaei

    2015-01-01

    Full Text Available Line nanopatterns are produced on the positive photoresist by scanning near-field optical microscope (SNOM. A laser diode with a wavelength of 450 nm and a power of 250 mW as the light source and an aluminum coated nanoprobe with a 70 nm aperture at the tip apex have been employed. A neutral density filter has been used to control the exposure power of the photoresist. It is found that the changes induced by light in the photoresist can be detected by in situ shear force microscopy (ShFM, before the development of the photoresist. Scanning electron microscope (SEM images of the developed photoresist have been used to optimize the scanning speed and the power required for exposure, in order to minimize the final line width. It is shown that nanometric lines with a minimum width of 33 nm can be achieved with a scanning speed of 75 µm/s and a laser power of 113 mW. It is also revealed that the overexposure of the photoresist by continuous wave laser generated heat can be prevented by means of proper photoresist selection. In addition, the effects of multiple exposures of nanopatterns on their width and depth are investigated.

  15. Somatic Embryos in Catharanthus roseus: A Scanning Electron Microscopic Study

    Directory of Open Access Journals (Sweden)

    Junaid ASLAM

    2014-06-01

    Full Text Available Catharanthus roseus (L. G. Don is an important medicinal plant as it contains several anti-cancerous compounds, like vinblastine and vincristine. Plant tissue culture technology (organogenesis and embryogenesis has currently been used in fast mass propagating raw materials for secondary metabolite synthesis. In this present communication, scanning electron microscopic (SEM study of somatic embryos was conducted and discussed. The embryogenic callus was first induced from hypocotyls of in vitro germinated seeds on which somatic embryos, differentiated in numbers, particularly on 2,4-D (1.0 mg/L Murashige and Skoog (MS was medium. To understand more about the regeneration method and in vitro formed embryos SEM was performed. The SEM study revealed normal somatic embryo origin and development from globular to heart-, torpedo- and then into cotyledonary-stage of embryos. At early stage, the embryos were clustered together in a callus mass and could not easily be detached from the parental tissue. The embryos were often long cylindrical structure with or without typical notch at the tip. Secondary embryos were also formed on primary embryo structure. The advanced cotyledonary embryos showed prominent roots and shoot axis, which germinated into plantlets. The morphology, structure and other details of somatic embryos at various stages were presented.

  16. Scanning reflection ion microscopy in a helium ion microscope

    Directory of Open Access Journals (Sweden)

    Yuri V. Petrov

    2015-05-01

    Full Text Available Reflection ion microscopy (RIM is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM. The reflected ions were detected by their “conversion” to secondary electrons on a platinum surface. An angle of incidence in the range 5–10° was used in the experimental setup. It was shown that the RIM image contrast was determined mostly by surface morphology but not by the atomic composition. A simple geometrical analysis of the reflection process was performed together with a Monte Carlo simulation of the angular dependence of the reflected ion yield. An interpretation of the RIM image formation and a quantification of the height of the surface steps were performed. The minimum detectable step height was found to be approximately 5 nm. RIM imaging of an insulator surface without the need for charge compensation was successfully demonstrated.

  17. Studies of Paramecium caudatum by means of scanning electron microscope and projection X-ray microscope.

    Science.gov (United States)

    Yada, Keiji; Abe, Taiki; Haga, Nobuyuki

    2009-01-01

    Samples of Paramecium caudatum are observed by means of a scanning electron microscope (SEM) and a projection X-ray microscope (XRM) with computer tomography (CT) function. The samples are fixed with two kinds of fixatives, glutaraldehyde and osmium-tetra oxide acid. After the fixation and replacement procedure with t-buthyl alcohol, the samples followed by a freeze drying, well retain their structures. Surface structures, cilia and microfibrillar systems including infraciliary lattice structures, are clearly depicted by SEM observation. On the other hand, XRM images give quite different information, namely, in the case of osmium oxide fixation, the structures of internal organelles like the macronucleus placed in the central part of cell body and trichocysts located under the cell membrane of a whole body are visible. In the case of glutaraldehyde fixation, the surface structures and internal structures are both visible but their image contrast is fairly weak. In order to examine toxicological effect, Paramecium caudatum samples treated in the environmental condition containing nano-particles of Ag (17 nm across) and Co-ferrite (300 nm across) are observed with results of certain morphological differences, namely, inner vacuoles increase in number and in volume in Co-ferrite treated cells as compared with Ag treated ones. But then, cilia-less areas increase on the surface of the body of Ag treated cells. In the case of Co-ferrite treated cells, cilia-less areas are not clearly detected. Whether these morphological differences observed in Ag and Co-ferrite treated cells are caused by the differences of materials or particle sizes remain to be examined in future.

  18. Autofocus on moving object in scanning electron microscope.

    Science.gov (United States)

    Kudryavtsev, Andrey V; Dembélé, Sounkalo; Piat, Nadine

    2017-11-01

    The sharpness of the images coming from a Scanning Electron Microscope (SEM) is a very important property for many computer vision applications at micro- and nanoscale. It represents how much object details are distinctive in the images: the object may be perceived sharp or blurred. Image sharpness highly depends on the value of focal distance, or working distance in the case of the SEM. Autofocus is the technique allowing to automatically adjust the working distance to maximize the sharpness. Most of the existing algorithms allows working only with a static object which is enough for the tasks of visualization, manual microanalysis or microcharacterization. These applications work with a low frame rate, less than 1 Hz, that guarantees a low level of noise. However, static autofocus can not be used for samples performing continuous 3D motion, which is the case of robotic applications where it is required to carry out a continuous 3D position measurement, e.g., nano-assembly or nanomanipulation. Moreover, in addition to constantly keeping object in focus while it is moving, it is required to perform the operation at high frame rate. The approach offering both these possibilities is presented in this paper and is referred as dynamic autofocus. The presented solution is based on stochastic optimization techniques. It allows tracking the maximum of the sharpness of the images without sweep and without training. It works under uncertainty conditions: presence of noise in images, unknown maximal sharpness and unknown 3D motion of the specimen. The experiments, that were performed with noisy images at high frame rate (5 Hz), were conducted on a Carl Zeiss Auriga 60 FE-SEM. They prove the robustness of the algorithm with respect to the variation of optimization parameters, object speed and magnification. Moreover, it is invariant to the object structure and its variation in time. Copyright © 2017 Elsevier B.V. All rights reserved.

  19. Visualizing bone porosities using a tabletop scanning electron microscope

    Science.gov (United States)

    Krishnamoorthy, D.; DaPonte, J.; Broadbridge, C. C.; Daniel, D.; Alter, L.

    2010-04-01

    Pores are naturally occurring entities in bone. Changes in pore size and number are often associated with diseases such as Osteoporosis and even microgravity during spaceflight. Studying bone perforations may yield great insight into bone's material properties, including bone density and may contribute to identifying therapies to halt or potentially reverse bone loss. Current technologies used in this field include nuclear magnetic resonance, micro-computed tomography and the field emission scanning electron microscope (FE-SEM) 2, 5. However, limitations in each method limit further advancement. The objective of this study was to assess the effectiveness of using a new generation of analytical instruments, the TM-1000 tabletop, SEM with back-scatter electron (BSE) detector, to analyze cortical bone porosities. Hind limb unloaded and age-based controlled mouse femurs were extracted and tested in vitro for changes in pores on the periosteal surface. An important advantage of using the tabletop is the simplified sample preparation that excludes extra coatings, dehydration and fixation steps that are otherwise required for conventional SEM. For quantitative data, pores were treated as particles in order to use an analyze particles feature in the NIH ImageJ software. Several image-processing techniques for background smoothing, thresholding and filtering were employed to produce a binary image suitable for particle analysis. It was hypothesized that the unloaded bones would show an increase in pore area, as the lack of mechanical loading would affect bone-remodeling processes taking place in and around pores. Preliminary results suggest only a slight different in frequency but not in size of pores between unloaded and control femurs.

  20. Neural Network for Nanoscience Scanning Electron Microscope Image Recognition.

    Science.gov (United States)

    Modarres, Mohammad Hadi; Aversa, Rossella; Cozzini, Stefano; Ciancio, Regina; Leto, Angelo; Brandino, Giuseppe Piero

    2017-10-16

    In this paper we applied transfer learning techniques for image recognition, automatic categorization, and labeling of nanoscience images obtained by scanning electron microscope (SEM). Roughly 20,000 SEM images were manually classified into 10 categories to form a labeled training set, which can be used as a reference set for future applications of deep learning enhanced algorithms in the nanoscience domain. The categories chosen spanned the range of 0-Dimensional (0D) objects such as particles, 1D nanowires and fibres, 2D films and coated surfaces, and 3D patterned surfaces such as pillars. The training set was used to retrain on the SEM dataset and to compare many convolutional neural network models (Inception-v3, Inception-v4, ResNet). We obtained compatible results by performing a feature extraction of the different models on the same dataset. We performed additional analysis of the classifier on a second test set to further investigate the results both on particular cases and from a statistical point of view. Our algorithm was able to successfully classify around 90% of a test dataset consisting of SEM images, while reduced accuracy was found in the case of images at the boundary between two categories or containing elements of multiple categories. In these cases, the image classification did not identify a predominant category with a high score. We used the statistical outcomes from testing to deploy a semi-automatic workflow able to classify and label images generated by the SEM. Finally, a separate training was performed to determine the volume fraction of coherently aligned nanowires in SEM images. The results were compared with what was obtained using the Local Gradient Orientation method. This example demonstrates the versatility and the potential of transfer learning to address specific tasks of interest in nanoscience applications.

  1. Micromachined fountain pen for atomic force microscope-based nanopatterning

    NARCIS (Netherlands)

    Deladi, S.; Tas, Niels Roelof; Berenschot, Johan W.; Krijnen, Gijsbertus J.M.; de Boer, Meint J.; de Boer, J.H.; Péter, M.; Elwenspoek, Michael Curt

    2004-01-01

    We present a tool that can be used in standard atomic force microscope and that enables chemical, chemical/mechanical, or physical surface modification using continuous liquid supply. The device consists of a reservoir micromachined into the probe support that is connected to fluidic channels

  2. A new concept in magnetic force microscope cantilevers

    NARCIS (Netherlands)

    van den Bos, A.G.; van Dijk, A.C.J.; Heskamp, I.R.; Abelmann, Leon; Lodder, J.C.; Hadjipanayis, G.C.

    2001-01-01

    In this paper, a new design of dedicated magnetic force microscope (MFM) cantilever is presented. In this design, the cantilever and the magnetic tip are realized in an integrated manufacturing process. The use of silicon micromachining techniques enables batch fabrication of several hundred

  3. New approaches to atomic force microscope lithography on silicon

    DEFF Research Database (Denmark)

    Birkelund, Karen; Thomsen, Erik Vilain; Rasmussen, Jan Pihl

    1997-01-01

    We have investigated new approaches to the formation of conducting nanowires on crystalline silicon surfaces using atomic force microscope (AFM) lithography. To increase processing speed and reduce wear of the AFM tip, large-scale structures are formed with a direct laser write setup, while the AFM...

  4. Stitching Grid-wise Atomic Force Microscope Images

    DEFF Research Database (Denmark)

    Vestergaard, Mathias Zacho; Bengtson, Stefan Hein; Pedersen, Malte

    2016-01-01

    Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this p...

  5. Fabrication of an all-metal atomic force microscope probe

    DEFF Research Database (Denmark)

    Rasmussen, Jan Pihl; Tang, Peter Torben; Hansen, Ole

    1997-01-01

    This paper presents a method for fabrication of an all-metal atomic force microscope probe (tip, cantilever and support) for optical read-out, using a combination of silicon micro-machining and electroforming. The paper describes the entire fabrication process for a nickel AFM-probe. In addition...

  6. Uncertainty quantification in nanomechanical measurements using the atomic force microscope

    Science.gov (United States)

    Ryan Wagner; Robert Moon; Jon Pratt; Gordon Shaw; Arvind Raman

    2011-01-01

    Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale...

  7. Investigations in high speed blanking: cutting forces and microscopic observations

    Directory of Open Access Journals (Sweden)

    Larue A.

    2010-06-01

    Full Text Available A new hopefull technique, called high speed blanking, has been investigated since few years. To understand the cutting process and how the tools have to be designed, this study is interrested in the cutting force measurement. A new cutting force measurement device has to be designed consider the industrial interest of such a study. The designed test bench induces a calibration process in order to stucy the cutting forces evolution. The paper is discussing the result that the peack load seems to decrease when the punch speed increases. Finally microscopic observations are made in order to find Adiabatic Shear Bands.

  8. Analysis of a copper sample for the CLIC ACS study in a field emission scanning microscope

    CERN Document Server

    Muranaka, Tomoko; Leifer, Klaus; Ziemann, Volker; Navitski, Aliaksandr; Müller, Günter

    2011-01-01

    We report measurements on a diamond turned Copper sample of material intended for the CLIC accelerating structures. The first part of the measurements was performed at Bergische Universität Wuppertal using a field emission scanning microscope to localize and characterize strong emission sites. In a second part the sample was investigated in an optical microscope, a white-light profilometer and scanning electron microscope in the microstructure laboratory in Uppsala to attempt to identify the features responsible for the field emission.

  9. A Compact Vertical Scanner for Atomic Force Microscopes

    Directory of Open Access Journals (Sweden)

    Jae Hong Park

    2010-11-01

    Full Text Available A compact vertical scanner for an atomic force microscope (AFM is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated.

  10. Field programmable gate array based reconfigurable scanning probe/optical microscope.

    Science.gov (United States)

    Nowak, Derek B; Lawrence, A J; Dzegede, Zechariah K; Hiester, Justin C; Kim, Cliff; Sánchez, Erik J

    2011-10-01

    The increasing popularity of nanometrology and nanospectroscopy has pushed researchers to develop complex new analytical systems. This paper describes the development of a platform on which to build a microscopy tool that will allow for flexibility of customization to suit research needs. The novelty of the described system lies in its versatility of capabilities. So far, one version of this microscope has allowed for successful near-field and far-field fluorescence imaging with single molecule detection sensitivity. This system is easily adapted for reflection, polarization (Kerr magneto-optical (MO)), Raman, super-resolution techniques, and other novel scanning probe imaging and spectroscopic designs. While collecting a variety of forms of optical images, the system can simultaneously monitor topographic information of a sample with an integrated tuning fork based shear force system. The instrument has the ability to image at room temperature and atmospheric pressure or under liquid. The core of the design is a field programmable gate array (FPGA) data acquisition card and a single, low cost computer to control the microscope with analog control circuitry using off-the-shelf available components. A detailed description of electronics, mechanical requirements, and software algorithms as well as examples of some different forms of the microscope developed so far are discussed.

  11. Versatile variable temperature and magnetic field scanning probe microscope for advanced material research

    Science.gov (United States)

    Jung, Jin-Oh; Choi, Seokhwan; Lee, Yeonghoon; Kim, Jinwoo; Son, Donghyeon; Lee, Jhinhwan

    2017-10-01

    We have built a variable temperature scanning probe microscope (SPM) that covers 4.6 K-180 K and up to 7 T whose SPM head fits in a 52 mm bore magnet. It features a temperature-controlled sample stage thermally well isolated from the SPM body in good thermal contact with the liquid helium bath. It has a 7-sample-holder storage carousel at liquid helium temperature for systematic studies using multiple samples and field emission targets intended for spin-polarized spectroscopic-imaging scanning tunneling microscopy (STM) study on samples with various compositions and doping conditions. The system is equipped with a UHV sample preparation chamber and mounted on a two-stage vibration isolation system made of a heavy concrete block and a granite table on pneumatic vibration isolators. A quartz resonator (qPlus)-based non-contact atomic force microscope (AFM) sensor is used for simultaneous STM/AFM operation for research on samples with highly insulating properties such as strongly underdoped cuprates and strongly correlated electron systems.

  12. Sub-nanosecond time-resolved near-field scanning magneto-optical microscope.

    Science.gov (United States)

    Rudge, J; Xu, H; Kolthammer, J; Hong, Y K; Choi, B C

    2015-02-01

    We report on the development of a new magnetic microscope, time-resolved near-field scanning magneto-optical microscope, which combines a near-field scanning optical microscope and magneto-optical contrast. By taking advantage of the high temporal resolution of time-resolved Kerr microscope and the sub-wavelength spatial resolution of a near-field microscope, we achieved a temporal resolution of ∼50 ps and a spatial resolution of microscope, the magnetic field pulse induced gyrotropic vortex dynamics occurring in 1 μm diameter, 20 nm thick CoFeB circular disks has been investigated. The microscope provides sub-wavelength resolution magnetic images of the gyrotropic motion of the vortex core at a resonance frequency of ∼240 MHz.

  13. Microscopic calculation of the restoring force for scissor isovector vibrations

    Energy Technology Data Exchange (ETDEWEB)

    Nojarov, R.; Bochnacki, Z.; Faessler, A.

    1986-07-01

    The restoring force for scissor isovector vibrations is calculated microscopically with the wave functions of an axially symmetric Woods-Saxon potential from a density-dependent symmetry energy. The experimental energies of the low-lying magnetic dipole states in rare-earth nuclei are well reproduced. It is found that only outer particles, which contribute to the nuclear moment of inertia, take part in this collective vibration. They are about half of the total number of nucleons.

  14. Online correction of scanning probe microscopes with pixel accuracy

    DEFF Research Database (Denmark)

    Dirscherl, Kai

    2000-01-01

    -20% depending on the piezo material used and the scan range. The change in sensitivity is up to 20% as well, depending on the scan frequency. Current software controlled SPM are equipped with an algorithm that changes the shape of the control voltage online in a way to produce a linear piezo movement...

  15. Numerical restoration of surface vortices in Nb films measured by a scanning SQUID microscope

    Science.gov (United States)

    Ito, Atsuki; Thanh Huy, Ho; Dang, Vu The; Miyoshi, Hiroki; Hayashi, Masahiko; Ishida, Takekazu

    2017-07-01

    In the present work, we investigated a vortex profile appeared on a pure Nb film (500 nm in thickness, 10 mm x 10 mm) by using a scanning SQUID microscope. We found that the local magnetic distribution thus observed is broadened compared to a true vortex profile in the superconducting film. We therefore applied the numerical method to improve a spatial resolution of the scanning SQUID microscope. The method is based on the inverse Biot-Savart law and the Fourier transformation to recover a real-space image. We found that the numerical analyses give a smaller vortex than the raw vortex profile observed by the scanning microscope.

  16. An Evanescent Field Optical Microscope. Scanning probe Microscopy

    NARCIS (Netherlands)

    van Hulst, N.F.; Segerink, Franciscus B.; Bölger, B.; Bölger, B.; Wickramasinghe, H. Kumar

    1991-01-01

    An Evanescent Field Optical Microscope (EFOM) is presented, which employs frustrated total internal reflection on a highly localized scale by means of a sharp dielectric tip. The coupling of the evanescent field to the sub-micrometer probe as a function of probe-sample distance, angle of incidence

  17. New scanning technique for the optical vortex microscope.

    Science.gov (United States)

    Augustyniak, Ireneusz; Popiołek-Masajada, Agnieszka; Masajada, Jan; Drobczyński, Sławomir

    2012-04-01

    In the optical vortex microscopy the focused Gaussian beam with optical vortex scans a sample. An optical vortex can be introduced into a laser beam with the use of a special optical element--a vortex lens. When moving the vortex lens, the optical vortex changes its position inside the spot formed by a focused laser beam. This effect can be used as a new precise scanning technique. In this paper, we study the optical vortex behavior at the sample plane. We also estimate if the new scanning technique results in observable effects that could be used for a phase object detection.

  18. A compact CCD-monitored atomic force microscope with optical vision and improved performances.

    Science.gov (United States)

    Mingyue, Liu; Haijun, Zhang; Dongxian, Zhang

    2013-09-01

    A novel CCD-monitored atomic force microscope (AFM) with optical vision and improved performances has been developed. Compact optical paths are specifically devised for both tip-sample microscopic monitoring and cantilever's deflection detecting with minimized volume and optimal light-amplifying ratio. The ingeniously designed AFM probe with such optical paths enables quick and safe tip-sample approaching, convenient and effective tip-sample positioning, and high quality image scanning. An image stitching method is also developed to build a wider-range AFM image under monitoring. Experiments show that this AFM system can offer real-time optical vision for tip-sample monitoring with wide visual field and/or high lateral optical resolution by simply switching the objective; meanwhile, it has the elegant performances of nanometer resolution, high stability, and high scan speed. Furthermore, it is capable of conducting wider-range image measurement while keeping nanometer resolution. Copyright © 2013 Wiley Periodicals, Inc.

  19. Depth Sectioning with the Aberration-Corrected Scanning Transmission Electron Microscope

    National Research Council Canada - National Science Library

    Albina Y. Borisevich; Andrew R. Lupini; Stephen J. Pennycook

    2006-01-01

    The ability to correct the aberrations of the probe-forming lens in the scanning transmission electron microscope provides not only a significant improvement in transverse resolution but in addition...

  20. Improved axial point spread function in a two-frequency laser scanning confocal fluorescence microscope.

    Science.gov (United States)

    Wu, Jheng-Syong; Chung, Yung-Chin; Chien, Jun-Jei; Chou, Chien

    2018-01-01

    A two-frequency laser scanning confocal fluorescence microscope (TF-LSCFM) based on intensity modulated fluorescence signal detection was proposed. The specimen-induced spherical aberration and scattering effect were suppressed intrinsically, and high image contrast was presented due to heterodyne interference. An improved axial point spread function in a TF-LSCFM compared with a conventional laser scanning confocal fluorescence microscope was demonstrated and discussed. (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

  1. [Scanning electron microscope study of chemically disinfected endodontic files].

    Science.gov (United States)

    Navarro, G; Mateos, M; Navarro, J L; Canalda, C

    1991-01-01

    Forty stainless steel endodontic files were observed at scanning electron microscopy after being subjected to ten disinfection cycles of 10 minutes each one, immersed in different chemical disinfectants. Corrosion was not observed on the surface of the files in circumstances that this study was made.

  2. Restoration of images from the scanning-tunneling microscope

    Science.gov (United States)

    Kokaram, A. C.; Persad, N.; Lasenby, J.; Fitzgerald, W. J.; McKinnon, A.; Welland, M.

    1995-08-01

    During the acquisition of an image from any probe microscope instrument, various noise sources cause distortion in the observed image. It is often the case that impulsive disturbances cause bright groups of pixels to replace the actual image data in these locations. Furthermore, the images from a probe microscope show some amount of blurring caused both by the instrument function and the material properties. In almost all image-processing applications it is important to remove any impulsive distortion that may be present before deblurring can be attempted. We give a technique for detecting these impulses and reconstructing the image. This technique is superior to the standard global application of median filters for the case considered. The reconstruction is limited only to the affected regions and therefore results in a much sharper and more meaningful image. With the assumption of Gaussian blur it is then possible to propose several different deblurring methodologies. We present a novel Wiener-filter deblurring implementation and compare it to both maximum-entropy and Richardson-Lucy deblurring.

  3. High-speed atomic force microscope based on an astigmatic detection system

    Science.gov (United States)

    Liao, H.-S.; Chen, Y.-H.; Ding, R.-F.; Huang, H.-F.; Wang, W.-M.; Hwu, E.-T.; Huang, K.-Y.; Chang, C.-S.; Hwang, I.-S.

    2014-10-01

    High-speed atomic force microscopy (HS-AFM) enables visualizing dynamic behaviors of biological molecules under physiological conditions at a temporal resolution of 1s or shorter. A small cantilever with a high resonance frequency is crucial in increasing the scan speed. However, detecting mechanical resonances of small cantilevers is technically challenging. In this study, we constructed an atomic force microscope using a digital versatile disc (DVD) pickup head to detect cantilever deflections. In addition, a flexure-guided scanner and a sinusoidal scan method were implemented. In this work, we imaged a grating sample in air by using a regular cantilever and a small cantilever with a resonance frequency of 5.5 MHz. Poor tracking was seen at the scan rate of 50 line/s when a cantilever for regular AFM imaging was used. Using a small cantilever at the scan rate of 100 line/s revealed no significant degradation in the topographic images. The results indicate that a smaller cantilever can achieve a higher scan rate and superior force sensitivity. This work shows the potential for using a DVD pickup head in future HS-AFM technology.

  4. Atomic force microscope characterization of a resonating nanocantilever

    DEFF Research Database (Denmark)

    Abadal, G.; Davis, Zachary James; Borrise, X.

    2003-01-01

    An atomic force microscope (AFM) is used as a nanometer-scale resolution tool for the characterization of the electromechanical behaviour of a resonant cantilever-based mass sensor. The cantilever is actuated electrostatically by applying DC and AC voltages from a driver electrode placed closely...... and of the oscillation amplitude on the frequency of the AC voltage is measured by this technique and the results are fitted by a simple non-linear electromechanical model. (C) 2003 Elsevier Science B.V. All rights reserved....

  5. Compact scanning transmission x-ray microscope at the photon factory

    Energy Technology Data Exchange (ETDEWEB)

    Takeichi, Yasuo, E-mail: yasuo.takeichi@kek.jp; Inami, Nobuhito; Ono, Kanta [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan); Suga, Hiroki [Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Takahashi, Yoshio [Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

    2016-01-28

    We report the design and performance of a compact scanning transmission X-ray microscope developed at the Photon Factory. Piezo-driven linear stages are used as coarse stages of the microscope to realize excellent compactness, mobility, and vibrational and thermal stability. An X-ray beam with an intensity of ∼10{sup 7} photons/s was focused to a diameter of ∼40 nm at the sample. At the soft X-ray undulator beamline used with the microscope, a wide range of photon energies (250–1600 eV) is available. The microscope has been used to research energy materials and in environmental sciences.

  6. Method to characterize the vibrational response of a beetle type scanning tunneling microscope

    Energy Technology Data Exchange (ETDEWEB)

    Behler, S.; Rose, M.K.; Ogletree, D.F.; Salmeron, M. [Materials Sciences Division, Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 (United States)

    1997-01-01

    We describe a method for analyzing the external vibrations and intrinsic mechanical resonances affecting scanning probe microscopes by using the microscope as an accelerometer. We show that clear correlations can be established between the frequencies of mechanical vibrational modes and the frequencies of peaks in the tunnel current noise power spectrum. When this method is applied to our {open_quotes}beetle{close_quotes} type scanning tunneling microscope (STM), we find unexpected low frequency {open_quotes}rattling resonances{close_quotes} in the 500{endash}1700 Hz range that depend on the exact lateral position of the STM, in addition to the expected mechanical resonances of the STM above 4 kHz which are in good agreement with theoretical estimates. We believe that these rattling resonances may be a general problem for scanning probe microscopes that use some type of kinetic motion for coarse positioning. {copyright} {ital 1997 American Institute of Physics.}

  7. Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.

    Science.gov (United States)

    Torun, H; Finkler, O; Degertekin, F L

    2009-07-01

    The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.

  8. Angularly-selective transmission imaging in a scanning electron microscope.

    Science.gov (United States)

    Holm, Jason; Keller, Robert R

    2016-08-01

    This work presents recent advances in transmission scanning electron microscopy (t-SEM) imaging control capabilities. A modular aperture system and a cantilever-style sample holder that enable comprehensive angular selectivity of forward-scattered electrons are described. When combined with a commercially available solid-state transmission detector having only basic bright-field and dark-field imaging capabilities, the advances described here enable numerous transmission imaging modes. Several examples are provided that demonstrate how contrast arising from diffraction to mass-thickness can be obtained. Unanticipated image contrast at some imaging conditions is also observed and addressed. Published by Elsevier B.V.

  9. [Current application of confocal laser scanning microscope (CLSM) in stomatology].

    Science.gov (United States)

    Zhang, Yu-sen; Li, Ning-yi

    2007-04-01

    Confocal laser scanning microscopy is one kind of modern Hi-tech on the basis of confocal imaging which is characterized by depth discrimination capability. It has been widely used in the field of stomatology due to its great advantages of non-destructive and non-invasive optical sectioning and three-dimensional reconstruction of the vital objects, in situ and dynamic real-time observation of the tissues and cells can be performed at high resolution. This paper reviews the fundamentals of confocal imaging and the application of CLSM in the fields of dental material, caries, dentin bonding interface and other basic researches in stomatology in recent years.

  10. Novel dual-probes atomic force microscope for line width measurements

    Science.gov (United States)

    Wang, Hequn; Gao, Sitian; Li, Wei; Shi, Yushu; Li, Qi; Li, Shi

    2017-11-01

    Dual-probe Atomic Force Microscope (AFM) can effectively eliminate the influence of the probe size on measurement of the line width, and realize true three-dimensional measurement. Novel dual-probe AFM consists of probe system, scanning system, alignment system and displacement measurement system. As displacement measurement system, the interferometers are added to the novel dual-probes AFM. In order to simplify the dual-probe AFM structure, self-sensing tuning fork probe is used. Measurement method has two steps: the first step is to align two probes and obtain the reference point; the second step is to scan two sides of measured line by two probes separately, and calculate the line width value according to the reference point. In the alignment of two probes, the alignment method is improved by using the edge alignment and the feedback scanning alignment.

  11. SPATIAL REPARTITION OF CURRENT FLUCTUATIONS IN A SCANNING TUNNELING MICROSCOPE

    Directory of Open Access Journals (Sweden)

    Jerome Lagoute

    2011-05-01

    Full Text Available Scanning Tunneling Microscopy (STM is a technique where the surface topography of a conducting sample is probed by a scanning metallic tip. The tip-to-surface distance is controlled by monitoring the electronic tunneling current between the two metals. The aim of this work is to extend the temporal range of this instrument by characterising the time fluctuations of this current on different surfaces. The current noise power spectral density is dominated by a characteristic 1/f component, the physical origin of which is not yet clearly identified, despite a number of investigations. A new I-V preamplifier was developed in order to characterise these fluctuations of the tunnelling current and to obtain images of their spatial repartition. It is observed that their intensity is correlated with some topographical features. This information can be used to get insights on the physical phenomena involved that are not accessible by the usual STM set-up, which is limited to low frequencies.

  12. Method for lateral force calibration in atomic force microscope using MEMS microforce sensor.

    Science.gov (United States)

    Dziekoński, Cezary; Dera, Wojciech; Jarząbek, Dariusz M

    2017-11-01

    In this paper we present a simple and direct method for the lateral force calibration constant determination. Our procedure does not require any knowledge about material or geometrical parameters of an investigated cantilever. We apply a commercially available microforce sensor with advanced electronics for direct measurement of the friction force applied by the cantilever's tip to a flat surface of the microforce sensor measuring beam. Due to the third law of dynamics, the friction force of the equal value tilts the AFM cantilever. Therefore, torsional (lateral force) signal is compared with the signal from the microforce sensor and the lateral force calibration constant is determined. The method is easy to perform and could be widely used for the lateral force calibration constant determination in many types of atomic force microscopes. Copyright © 2017 Elsevier B.V. All rights reserved.

  13. Angularly-selective transmission imaging in a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Holm, Jason, E-mail: jason.holm@nist.gov; Keller, Robert R.

    2016-08-15

    This work presents recent advances in transmission scanning electron microscopy (t-SEM) imaging control capabilities. A modular aperture system and a cantilever-style sample holder that enable comprehensive angular selectivity of forward-scattered electrons are described. When combined with a commercially available solid-state transmission detector having only basic bright-field and dark-field imaging capabilities, the advances described here enable numerous transmission imaging modes. Several examples are provided that demonstrate how contrast arising from diffraction to mass-thickness can be obtained. Unanticipated image contrast at some imaging conditions is also observed and addressed. - Highlights: • A modular aperture system for STEM-in-SEM imaging is described. • A flexible cantilever sample holder that can maximize camera length is described. • The aperture system and sample holder enable complete acceptance angle control. • Most STEM imaging modes can be implemented without multi-segment detectors.

  14. Optimization of Easy Atomic Force Microscope (ezAFM) Controls for Semiconductor Nanostructure Profiling

    Science.gov (United States)

    2017-09-01

    Laboratory recently procured an Easy Atomic Force Microscope (ezAFM), from a NanoMagnetics vendor. The ezAFM can profile nanostructures on the order of 2.0 Å...just as previous AFMs do. This allows for scans of possible defects of sample surfaces, as well as displays of changes in topography. In using the...the cross-sectional graph provides an approximation of the noise. Less than 2 Å is ideal. It is possible to observe relative noise by observing the

  15. Cryogenic positioning and alignment with micrometer precision in a magnetic resonance force microscope

    Science.gov (United States)

    Isaac, Corinne E.; Curley, Elizabeth A.; Nasr, Paméla T.; Nguyen, Hoang L.; Marohn, John A.

    2018-01-01

    Aligning a microcantilever to an area of interest on a sample is a critical step in many scanning probe microscopy experiments, particularly those carried out on devices and rare, precious samples. We report a series of protocols that rapidly and reproducibly align a high-compliance microcantilever to a resonance frequency while laterally scanning the tip to map the sample substrate through electrostatic interactions of the substrate with the cantilever. We demonstrate that when operating a cantilever a few micrometers from the sample surface, large shifts in the cantilever resonance frequency are present near the edges of a voltage-biased sample electrode. Surprisingly, these "edge-finder" frequency shifts are retained when the electrode is coated with a polymer film and a ˜10 nm thick metallic ground plane. The second series of methods, applicable to any scanning probe microscopy experiment, integrate a single-optical fiber to image line scans of the sample surface. The microscope modifications required for these methods are straightforward to implement, provide reliable micrometer-scale positioning, and decrease the experimental setup time from days to hours in a vacuum, cryogenic magnetic resonance force microscope.

  16. Local potentiometry using a multiprobe scanning tunneling microscope.

    Science.gov (United States)

    Bannani, A; Bobisch, C A; Möller, R

    2008-08-01

    Scanning tunneling potentiometry (STP) is a powerful tool to analyze the conductance through thin conducting layers with lateral resolution in the nanometer range. In this work, we show how a commercial ultrahigh vacuum multiprobe system, equipped with four independent tips, can be used to perform STP experiments. Two tips are gently pushed into the surface applying a lateral current through the layer of interest. Simultaneously, the topography and the potential distribution across the metal film are measured with a third tip. The signal-to-noise ratio of the potentiometry signal may be enhanced by using a fourth tip, providing a reference potential in close vicinity of the studied area. Two different examples are presented. For epitaxial (111) oriented Bi films, grown on a Si(100)-(2 x 1) surface, an almost constant gradient of the potential as well as potential drops at individual Bi-domain boundaries were observed. On the surface of the Si(111)(3 x 3)-Ag superstructure the potential variation at individual monoatomic steps could be precisely resolved.

  17. A low temperature scanning force microscope for biological samples

    Energy Technology Data Exchange (ETDEWEB)

    Gustafsson, Mats Gustaf Lennart [Univ. of California, Berkeley, CA (United States)

    1993-05-01

    An SFM has been constructed capable of operating at 143 K. Two contributions to SFM technology are described: a new method of fabricating tips, and new designs of SFM springs that significantly lower the noise level. The SFM has been used to image several biological samples (including collagen, ferritin, RNA, purple membrane) at 143 K and room temperature. No improvement in resolution resulted from 143 K operation; several possible reasons for this are discussed. Possibly sharper tips may help. The 143 K SFM will allow the study of new categories of samples, such as those prepared by freeze-frame, single molecules (temperature dependence of mechanical properties), etc. The SFM was used to cut single collagen molecules into segments with a precision of {le} 10 nm.

  18. Investigating Single Molecule Physics with the Scanning Tunneling Microscope

    Science.gov (United States)

    Patel, Calvin Jay

    Scanning tunneling microscopy (STM) has given the scientific community a method to view, characterize, and manipulate the world at the atomic scale. Thirty years after the Nobel Prize in Physics was awarded for its invention, the remarkable instrument is still being used to deepen our understanding of physical and chemical processes. Tantamount to this has been the development of new techniques to expand its capabilities allowing STMs to answer increasingly more difficult scientific questions. This dissertation describes three technological thrusts in expanding the STMs capabilities in studying physics at the single molecule level. First, I have helped developed a new technique called the RF-STM which has the potential to snapshot femtosecond and picosecond processes by locking into the high frequency tunneling component generated from the 80MHz laser pulse train. This technique solves the problem of low frequency thermal oscillations when choppers are used in the beam line and if only tunneling signal is monitored, sub-angstrom spatial resolution should be simultaneously possible. Second, I have helped develop the itProbe technique by increasing its ability to map out the interaction potential energy surface (iPES) between a tip-CO molecule and a surface adsorbed molecule. I present a study conducted on the bridge-like 1,4 phenylene diisocyanide molecule where the iPES is probed at different heights and different energies. The result is an ability to 3-dimensionally map out the iPES and provide reliable insight into developing itProbe simulations. Third, I have developed a new technique called Energy Resolved Laser Action STM (ERLA-STM) where we can observe the change in molecular dynamics as a function of the illumination wavelength. In our pyrrolidine study, we demonstrated the kinetic changes that occur when an overtone of the CH stretch mode is excited by a near-IR laser pulse. By sweeping the excitation energy, we can characterize and control single molecule

  19. The development of a novel electromagnetic force microscope

    CERN Document Server

    Windmill, J F C

    2002-01-01

    This thesis describes the development of a new type of Magnetic Force Microscope (MFM) probe based on a unique electromagnetic design. In addition the design, construction and testing of a new MFM system, complete in both hardware and software, is also described. The MFM allowed initial tests on prototypes of the new probe, and is to provide a base for future new probe integration. The microscope uses standard MFM micro-cantilever probes in static modes of imaging. A new computer hosted DSP control system, software, and its various interfaces with the MFM have been integrated into the system. The system has been tested using standard probes with various specimens and satisfactory results have been produced. A novel probe has been designed to replace the standard MFM magnetic coated tip with a field generated about a sub-micron aperture in a conducting film. The field from the new probe is modelled and its imaging capability investigated, with iterative designs analysed in this way. The practical construction ...

  20. Upgrade of a Scanning Confocal Microscope to a Single-Beam Path STED Microscope.

    Directory of Open Access Journals (Sweden)

    André Klauss

    Full Text Available By overcoming the diffraction limit in light microscopy, super-resolution techniques, such as stimulated emission depletion (STED microscopy, are experiencing an increasing impact on life sciences. High costs and technically demanding setups, however, may still hinder a wider distribution of this innovation in biomedical research laboratories. As far-field microscopy is the most widely employed microscopy modality in the life sciences, upgrading already existing systems seems to be an attractive option for achieving diffraction-unlimited fluorescence microscopy in a cost-effective manner. Here, we demonstrate the successful upgrade of a commercial time-resolved confocal fluorescence microscope to an easy-to-align STED microscope in the single-beam path layout, previously proposed as "easy-STED", achieving lateral resolution < λ/10 corresponding to a five-fold improvement over a confocal modality. For this purpose, both the excitation and depletion laser beams pass through a commercially available segmented phase plate that creates the STED-doughnut light distribution in the focal plane, while leaving the excitation beam unaltered when implemented into the joint beam path. Diffraction-unlimited imaging of 20 nm-sized fluorescent beads as reference were achieved with the wavelength combination of 635 nm excitation and 766 nm depletion. To evaluate the STED performance in biological systems, we compared the popular phalloidin-coupled fluorescent dyes Atto647N and Abberior STAR635 by labeling F-actin filaments in vitro as well as through immunofluorescence recordings of microtubules in a complex epithelial tissue. Here, we applied a recently proposed deconvolution approach and showed that images obtained from time-gated pulsed STED microscopy may benefit concerning the signal-to-background ratio, from the joint deconvolution of sub-images with different spatial information which were extracted from offline time gating.

  1. Nanostethoscopy: A new mode of operation of the atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Keaton, A.; Holzrichter, J.F.; Balhorn, R.; Siekaus, W.J.

    1994-02-01

    The authors introduce a new mode of operation of the atomic force microscope (AFM). This detection scheme, a {open_quotes}Nano-Stethoscope{close_quotes}. Involves using the atomic force microscope in a novel acoustic mode not generally recognized. The Nano-Stethoscope uses the conventional scanning feature to locate a desired site, positions the AFM microscope tip over the site, holds the cantilever stationary (in x and v) and records the tip`s z-motion as a function of time. The tip/cantilever system thus functions as a micro-motion detector to respond to characteristic {open_quotes}pulsations{close_quotes}, nano-configurational chances, or any other event that influences the position of the tip as a function of time. The authors have demonstrated the feasibility of using the tip of an AFM in this manner in a biological system with a measurement of the vibrations of an emerging shrimp egg nauplius ({approximately}3 {mu}m. -10 Hz) and on the Angstrom scale in a non-biological system i.e.. the thermal expansion of metal interconnect lines on a microelectronic circuit.

  2. The atomic force microscope as a mechano–electrochemical pen

    Directory of Open Access Journals (Sweden)

    Christian Obermair

    2011-10-01

    Full Text Available We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead, a passivated sample surface is activated locally due to lateral forces between the AFM tip and the sample surface. In this way, the area of tip–sample interaction is narrowly limited by the mechanical contact between tip and sample, and well-defined metallic patterns can be written reproducibly. Nanoscale structures and lines of copper were deposited, and the line widths ranged between 5 nm and 80 nm, depending on the deposition parameters. A procedure for the sequential writing of metallic nanostructures is introduced, based on the understanding of the passivation process. The mechanism of this mechano–electrochemical writing technique is investigated, and the processes of site-selective surface depassivation, deposition, dissolution and repassivation of electrochemically deposited nanoscale metallic islands are studied in detail.

  3. The magnetic resonance force microscope: A new microscopic probe of magnetic materials

    Energy Technology Data Exchange (ETDEWEB)

    Hammel, P.C.; Zhang, Z. [Los Alamos National Lab., NM (United States); Midzor, M.; Roukes, M.L. [California Inst. of Tech., Pasadena, CA (United States); Wigen, P.E. [Ohio State Univ., Columbus, OH (United States); Childress, J.R. [Univ. of Florida, Gainesville, FL (United States)

    1997-08-06

    The magnetic resonance force microscope (MRFM) marries the techniques of magnetic resonance imaging (MRI) and atomic force microscopy (AFM), to produce a three-dimensional imaging instrument with high, potentially atomic-scale, resolution. The principle of the MRFM has been successfully demonstrated in numerous experiments. By virtue of its unique capabilities the MRFM shows promise to make important contributions in fields ranging from three-dimensional materials characterization to bio-molecular structure determination. Here the authors focus on its application to the characterization and study of layered magnetic materials; the ability to illuminate the properties of buried interfaces in such materials is a particularly important goal. While sensitivity and spatial resolution are currently still far from their theoretical limits, they are nonetheless comparable to or superior to that achievable in conventional MRI. Further improvement of the MRFM will involve operation at lower temperature, application of larger field gradients, introduction of advanced mechanical resonators and improved reduction of the spurious coupling when the magnet is on the resonator.

  4. A Video Rate Confocal Laser Beam Scanning Light Microscope Using An Image Dissector

    Science.gov (United States)

    Goldstein, Seth R.; Hubin, Thomas; Rosenthal, Scott; Washburn, Clayton

    1989-12-01

    A video rate confocal reflected light microscope with no moving parts has been developed. Return light from an acousto-optically raster scanned laser beam is imaged from the microscope stage onto the photocathode of an Image Dissector Tube (IDT). Confocal operation is achieved by appropriately raster scanning with the IDT x and y deflection coils so as to continuously "sample" that portion of the photocathode that is being instantaneously illuminated by the return image of the scanning laser spot. Optimum IDT scan parameters and geometric distortion correction parameters are determined under computer control within seconds and are then continuously applied to insure system alignment. The system is operational and reflected light images from a variety of objects have been obtained. The operating principle can be extended to fluorescence and transmission microscopy.

  5. Examination of mycological samples by means of the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M. Thibaut

    1973-04-01

    Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.

  6. Atomic force and optical near-field microscopic investigations of polarization holographic gratings in a liquid crystalline azobenzene side-chain polyester

    DEFF Research Database (Denmark)

    Ramanujam, P.S.; Holme, N.C.R.; Hvilsted, S.

    1996-01-01

    Atomic force and scanning near-field optical microscopic investigations have been carried out on a polarization holographic grating recorded in an azobenzene side-chain Liquid crystalline polyester. It has been found that immediately following laser irradiation, a topographic surface grating......-field optical microscopic scanning of the grating reveals, however, that the bulk of the film remains optically anisotropic. (C) 1996 American Institute of Physics....

  7. Masked illumination scheme for a galvanometer scanning high-speed confocal fluorescence microscope.

    Science.gov (United States)

    Kim, Dong Uk; Moon, Sucbei; Song, Hoseong; Kwon, Hyuk-Sang; Kim, Dug Young

    2011-01-01

    High-speed beam scanning and data acquisition in a laser scanning confocal microscope system are normally implemented with a resonant galvanometer scanner and a frame grabber. However, the nonlinear scanning speed of a resonant galvanometer can generate nonuniform photobleaching in a fluorescence sample as well as image distortion near the edges of a galvanometer scanned fluorescence image. Besides, incompatibility of signal format between a frame grabber and a point detector can lead to digitization error during data acquisition. In this article, we introduce a masked illumination scheme which can effectively decrease drawbacks in fluorescence images taken by a laser scanning confocal microscope with a resonant galvanometer and a frame grabber. We have demonstrated that the difference of photobleaching between the center and the edge of a fluorescence image can be reduced from 26 to 5% in our confocal laser scanning microscope with a square illumination mask. Another advantage of our masked illumination scheme is that the zero level or the lowest input level of an analog signal in a frame grabber can be accurately set by the dark area of a mask in our masked illumination scheme. We have experimentally demonstrated the advantages of our masked illumination method in detail. Copyright © 2011 Wiley Periodicals, Inc.

  8. Biophysical Measurements of Cells, Microtubules, and DNA with an Atomic Force Microscope

    CERN Document Server

    Devenica, Luka M; Cabrejo, Raysa; Kurek, Matthew; Deveney, Edward F; Carter, Ashley R

    2015-01-01

    Atomic force microscopes (AFMs) are ubiquitous in research laboratories and have recently been priced for use in teaching laboratories. Here we review several AFM platforms (Dimension 3000 by Digital Instruments, EasyScan2 by Nanosurf, ezAFM by Nanomagnetics, and TKAFM by Thorlabs) and describe various biophysical experiments that could be done in the teaching laboratory using these instruments. In particular, we focus on experiments that image biological materials and quantify biophysical parameters: 1) imaging cells to determine membrane tension, 2) imaging microtubules to determine their persistence length, 3) imaging the random walk of DNA molecules to determine their contour length, and 4) imaging stretched DNA molecules to measure the tensional force.

  9. Performance assessment of methods for estimation of fractal dimension from scanning electron microscope images.

    Science.gov (United States)

    Risović, Dubravko; Pavlović, Zivko

    2013-01-01

    Processing of gray scale images in order to determine the corresponding fractal dimension is very important due to widespread use of imaging technologies and application of fractal analysis in many areas of science, technology, and medicine. To this end, many methods for estimation of fractal dimension from gray scale images have been developed and routinely used. Unfortunately different methods (dimension estimators) often yield significantly different results in a manner that makes interpretation difficult. Here, we report results of comparative assessment of performance of several most frequently used algorithms/methods for estimation of fractal dimension. To that purpose, we have used scanning electron microscope images of aluminum oxide surfaces with different fractal dimensions. The performance of algorithms/methods was evaluated using the statistical Z-score approach. The differences between performances of six various methods are discussed and further compared with results obtained by electrochemical impedance spectroscopy on the same samples. The analysis of results shows that the performance of investigated algorithms varies considerably and that systematically erroneous fractal dimensions could be estimated using certain methods. The differential cube counting, triangulation, and box counting algorithms showed satisfactory performance in the whole investigated range of fractal dimensions. Difference statistic is proved to be less reliable generating 4% of unsatisfactory results. The performances of the Power spectrum, Partitioning and EIS were unsatisfactory in 29%, 38%, and 75% of estimations, respectively. The results of this study should be useful and provide guidelines to researchers using/attempting fractal analysis of images obtained by scanning microscopy or atomic force microscopy. © Wiley Periodicals, Inc.

  10. Interfacial structure of poly-{alpha}-olefin laminate by using scanning thermal microscope

    Energy Technology Data Exchange (ETDEWEB)

    Kotera, Masaru, E-mail: kotera@kobe-u.ac.jp [Department of Chemical Science and Engineering, Graduate School of Engineering, Kobe University, Rokko, Nada, Kobe 657-8501 (Japan); Urushihara, Yoshimasa [Hyogo Science and Technology Association, Kouto, Shingu, Tatsuno, Hyogo 679-5165 (Japan); Izumo, Daiki; Nishino, Takashi [Department of Chemical Science and Engineering, Graduate School of Engineering, Kobe University, Rokko, Nada, Kobe 657-8501 (Japan)

    2012-03-10

    Highlights: Black-Right-Pointing-Pointer Interfacial structure of laminated PE/PP film was investigated by SThM. Black-Right-Pointing-Pointer Spatial resolution of SThM technique was estimated to be 1.5 {mu}m. Black-Right-Pointing-Pointer High-contrast image of apparent thermal conductivity could be observed at the interfacial region. Black-Right-Pointing-Pointer Interfacial thickness, which depends on the thermal treatment of the laminate film, was estimated to be in micrometer order. - Abstract: The interfacial structure of laminated poly-{alpha}-olefin, polyethylene (PE)/polypropylene (PP), film was investigated by scanning thermal microscope (SThM). Spatial resolution of this technique was estimated as 1.5 {mu}m. Notwithstanding the flatness of the sample as observed in the height image of an atomic force micrograph, micro-thermomechanical analysis could distinguish each polymer. By scanning the thermal probe at isothermal temperature over a cross-section of the laminate film, a high-contrast image of apparent thermal conductivity at the interfacial region was obtained. The interfacial thickness was estimated to be in the micrometer order depending on the thermal treatment of the laminate film. This result coincides with the results of synchrotron X-ray microbeam diffraction. Moreover, the peel strength of the PE/PP laminate was considered to be influenced by the interfacial thickness. It is concluded that this proposed thermal-probe method is as a powerful tool for investigating the interfacial region of the polymer composites.

  11. Atomic force microscope-based single-molecule force spectroscopy of RNA unfolding.

    Science.gov (United States)

    Heus, Hans A; Puchner, Elias M; van Vugt-Jonker, Aafke J; Zimmermann, Julia L; Gaub, Hermann E

    2011-07-01

    Single-molecule force spectroscopy (SMFS) using the atomic force microscope (AFM) has emerged as an important tool for probing biomolecular interaction and exploring the forces, dynamics, and energy landscapes that underlie function and specificity of molecular interaction. These studies require attaching biomolecules on solid supports and AFM tips to measure unbinding forces between individual binding partners. Herein we describe efficient and robust protocols for probing RNA interaction by AFM and show their value on two well-known RNA regulators, the Rev-responsive element (RRE) from the HIV-1 genome and an adenine-sensing riboswitch. The results show the great potential of AFM-SMFS in the investigation of RNA molecular interactions, which will contribute to the development of bionanodevices sensing single RNA molecules. Copyright © 2011 Elsevier Inc. All rights reserved.

  12. Parallel electron-beam-induced deposition using a multi-beam scanning electron microscope

    NARCIS (Netherlands)

    Post, P.C.; Mohammadi-Gheidari, A.; Hagen, C.W.; Kruit, P.

    2011-01-01

    Lithography techniques based on electron-beam-induced processes are inherently slow compared to light lithography techniques. The authors demonstrate here that the throughput can be enhanced by a factor of 196 by using a scanning electron microscope equipped with a multibeam electron source. Using

  13. Imaging systems in the Delft Multi-Beam Scanning Electron Microscope 1

    NARCIS (Netherlands)

    Ren, Y.

    2017-01-01

    The goal of this Ph.D. research is to develop imaging systems for the multiple beam scanning electron microscope (MBSEM) built in Delft University of Technology. This thesis includes two imaging systems, transmission electron (TE) imaging system, and secondary electron (SE) imaging system. The major

  14. Imaging of surface plasmon polariton interference using phase-sensitive scanning tunneling microscope

    NARCIS (Netherlands)

    Jose, J.; Segerink, Franciscus B.; Korterik, Jeroen P.; Herek, Jennifer Lynn; Offerhaus, Herman L.

    2011-01-01

    We report the surface plasmon polariton interference, generated via a ‘buried’ gold grating, and imaged using a phase-sensitive Photon Scanning Tunneling Microscope (PSTM). The phase-resolved PSTM measurement unravels the complex surface plasmon polariton interference fields at the gold-air

  15. Transmission electron imaging in the Delft multibeam scanning electron microscope 1

    NARCIS (Netherlands)

    Ren, Y.; Kruit, P.

    2016-01-01

    Our group is developing a multibeam scanning electron microscope (SEM) with 196 beams in order to increase the throughput of SEM. Three imaging systems using, respectively, transmission electron detection, secondary electron detection, and backscatter electron detection are designed in order to

  16. Scanning electron microscopic observation of the brown tumor of the head of mandible.

    Science.gov (United States)

    Tunali, Selcuk; Celik, Hamdi H; Uslu, Sabri S; Aldur, Mustafa M

    2005-05-01

    Brown tumors are tumor-like, expansile osteolytic lesions of bone which are seen in both primary and secondary hyperparathyroidism. They generally resolve after surgical treatment of the parathyroid adenoma. Here, we report a case of brown tumor of the mandible of a cadaver with its scanning electron microscopic observation and review of literature.

  17. Observation of magnetic domains using a reflection mode scanning near-field optical microscope

    NARCIS (Netherlands)

    Durkam, C.; Shvets, I.V.; Lodder, J.C.

    1997-01-01

    It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of

  18. Measurements with an ultrafast scanning tunnelling microscope on photoexcited semiconductor layers

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1998-01-01

    Summary form only given. We demonstrate the use of a ultrafast scanning tunnelling microscopes (USTM) for detecting laser-induced field transients on semiconductor layers. In principle, the instrument can detect transient field changes thus far observed as far-field THz radiation in the near-fiel...

  19. Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

    Science.gov (United States)

    Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao

    2016-01-01

    Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke's tabulated data.

  20. Quantitative phase tomography by using x-ray microscope with Foucault knife-edge scanning filter

    Energy Technology Data Exchange (ETDEWEB)

    Watanabe, Norio; Tsuburaya, Yuji; Shimada, Akihiro; Aoki, Sadao [Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki, 305-8573 (Japan)

    2016-01-28

    Quantitative phase tomography was evaluated by using a differential phase microscope with a Foucault knife-edge scanning filter. A 3D x-ray phase image of polystyrene beads was obtained at 5.4 keV. The reconstructed refractive index was fairly good agreement with the Henke’s tabulated data.

  1. Quasi interference of perpendicularly polarized guided modes observed with a photon scanning tunneling microscope

    NARCIS (Netherlands)

    Balistreri, M.L.M.; Driessen, A.; Korterik, Jeroen P.; Kuipers, L.; van Hulst, N.F.

    2000-01-01

    The simultaneous detection of TE- as well as TM-polarized light with a photon scanning tunneling microscope leads to a quasi- interference pattern of these mutually perpendicular polarized fields. This interference pattern has been observed in the optical field distribution as a function of both

  2. Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

    Science.gov (United States)

    Jones, L; Nellist, P D

    2014-05-01

    In the scanning transmission electron microscope, hardware aberration correctors can now correct for the positive spherical aberration of round electron lenses. These correctors make use of nonround optics such as hexapoles or octupoles, leading to the limiting aberrations often being of a nonround type. Here we explore the effect of a number of potential limiting aberrations on the imaging performance of the scanning transmission electron microscope through their resulting optical transfer functions. In particular, the response of the optical transfer function to changes in defocus are examined, given that this is the final aberration to be tuned just before image acquisition. The resulting three-dimensional optical transfer functions also allow an assessment of the performance of a system for focal-series experiments or optical sectioning applications. © 2014 The Authors Journal of Microscopy © 2014 Royal Microscopical Society.

  3. A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions

    DEFF Research Database (Denmark)

    Holm, Jesper; Mygind, Jesper

    1995-01-01

    A novel cryogenic scanning laser microscope with a spatial resolution of less than 5 µm has been designed for on-chip in situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit...... to a very localized heating induced by irradiation with 675 nm wavelength light from a semiconductor laser. The hot spot is moved by a specially designed piezoelectric scanner sweeping the tip of a single-mode optical fiber a few µm above the circuit. Depending on the scanner design the scanning area can...... be as large as 50×500 µm2 at 4.2 K. The microscope can be operated in the temperature range 2–300 K using a standard temperature controller. The central microscope body is mounted inside the vacuum can of a dip-stick-type cryoprobe. A damped spring system is used to reduce interference from extraneous...

  4. Uncertainty quantification in nanomechanical measurements using the atomic force microscope

    Science.gov (United States)

    Wagner, Ryan; Moon, Robert; Pratt, Jon; Shaw, Gordon; Raman, Arvind

    2011-11-01

    Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and biological surfaces and nanomaterials. We present a framework to ascribe uncertainty to local nanomechanical properties of any nanoparticle or surface measured with the AFM by taking into account the main uncertainty sources inherent in such measurements. We demonstrate the framework by quantifying uncertainty in AFM-based measurements of the transverse elastic modulus of cellulose nanocrystals (CNCs), an abundant, plant-derived nanomaterial whose mechanical properties are comparable to Kevlar fibers. For a single, isolated CNC the transverse elastic modulus was found to have a mean of 8.1 GPa and a 95% confidence interval of 2.7-20 GPa. A key result is that multiple replicates of force-distance curves do not sample the important sources of uncertainty, which are systematic in nature. The dominant source of uncertainty is the nondimensional photodiode sensitivity calibration rather than the cantilever stiffness or Z-piezo calibrations. The results underscore the great need for, and open a path towards, quantifying and minimizing uncertainty in AFM-based material property measurements of nanoparticles, nanostructured surfaces, thin films, polymers and biomaterials. This work is a partial contribution of the USDA Forest Service and NIST, agencies of the US government, and is not subject to copyright.

  5. Confocal fluorescence microscope with dual-axis architecture and biaxial postobjective scanning.

    Science.gov (United States)

    Wang, Thomas D; Contag, Christopher H; Mandella, Michael J; Chan, Ning Y; Kino, Gordon S

    2004-01-01

    We present a novel confocal microscope that has dual-axis architecture and biaxial postobjective scanning for the collection of fluorescence images from biological specimens. This design uses two low-numerical-aperture lenses to achieve high axial resolution and long working distance, and the scanning mirror located distal to the lenses rotates along the orthogonal axes to produce arc-surface images over a large field of view (FOV). With fiber optic coupling, this microscope can potentially be scaled down to millimeter dimensions via microelectromechanical systems (MEMS) technology. We demonstrate a benchtop prototype with a spatial resolution < or =4.4 microm that collects fluorescence images with a high SNR and a good contrast ratio from specimens expressing GFP. Furthermore, the scanning mechanism produces only small differences in aberrations over the image FOV. These results demonstrate proof of concept of the dual-axis confocal architecture for in vivo molecular and cellular imaging.

  6. Evaluation of Enterococcus faecalis adhesion, penetration, and method to prevent the penetration of Enterococcus faecalis into root cementum: Confocal laser scanning microscope and scanning electron microscope analysis.

    Science.gov (United States)

    Halkai, Rahul S; Hegde, Mithra N; Halkai, Kiran R

    2016-01-01

    To ascertain the role of Enterococcus faecalis in persistent infection and a possible method to prevent the penetration of E. faecalis into root cementum. One hundred and twenty human single-rooted extracted teeth divided into five groups. Group I (control): intact teeth, Group II: no apical treatment done, Group III divided into two subgroups. In Groups IIIa and IIIb, root apex treated with lactic acid of acidic and neutral pH, respectively. Group IV: apical root cementum exposed to lactic acid and roughened to mimic the apical resorption. Group V: apical treatment done same as Group IV and root-end filling done using mineral trioxide aggregate (MTA). Apical one-third of all samples immersed in E. faecalis broth for 8 weeks followed by bone morphogenetic protein and obturation and again immersed into broth for 8 weeks. Teeth split into two halves and observed under confocal laser scanning microscope and scanning electron microscope, organism identified by culture and polymerase chain reaction techniques. Adhesion and penetration was observed in Group IIIa and Group IV. Only adhesion in Group II and IIIB and no adhesion and penetration in Group I and V. Adhesion and penetration of E. faecalis into root cementum providing a long-term nidus for subsequent infection are the possible reason for persistent infection and root-end filling with MTA prevents the adhesion and penetration.

  7. Evaluation of Enterococcus faecalis adhesion, penetration, and method to prevent the penetration of Enterococcus faecalis into root cementum: Confocal laser scanning microscope and scanning electron microscope analysis

    Science.gov (United States)

    Halkai, Rahul S.; Hegde, Mithra N.; Halkai, Kiran R.

    2016-01-01

    Aim: To ascertain the role of Enterococcus faecalis in persistent infection and a possible method to prevent the penetration of E. faecalis into root cementum. Methodology: One hundred and twenty human single-rooted extracted teeth divided into five groups. Group I (control): intact teeth, Group II: no apical treatment done, Group III divided into two subgroups. In Groups IIIa and IIIb, root apex treated with lactic acid of acidic and neutral pH, respectively. Group IV: apical root cementum exposed to lactic acid and roughened to mimic the apical resorption. Group V: apical treatment done same as Group IV and root-end filling done using mineral trioxide aggregate (MTA). Apical one-third of all samples immersed in E. faecalis broth for 8 weeks followed by bone morphogenetic protein and obturation and again immersed into broth for 8 weeks. Teeth split into two halves and observed under confocal laser scanning microscope and scanning electron microscope, organism identified by culture and polymerase chain reaction techniques. Results: Adhesion and penetration was observed in Group IIIa and Group IV. Only adhesion in Group II and IIIB and no adhesion and penetration in Group I and V. Conclusion: Adhesion and penetration of E. faecalis into root cementum providing a long-term nidus for subsequent infection are the possible reason for persistent infection and root-end filling with MTA prevents the adhesion and penetration. PMID:27994316

  8. Phase-gradient contrast in thick tissue with a scanning microscope.

    Science.gov (United States)

    Mertz, J; Gasecka, A; Daradich, A; Davison, I; Coté, D

    2014-02-01

    It is well known that the principle of reciprocity is valid for light traveling even through scattering or absorptive media. This principle has been used to establish an equivalence between conventional widefield microscopes and scanning microscopes. We make use of this principle to introduce a scanning version of oblique back-illumination microscopy, or sOBM. This technique provides sub-surface phase-gradient and amplitude images from unlabeled tissue, in an epi-detection geometry. That is, it may be applied to arbitrarily thick tissue. sOBM may be implemented as a simple, cost-effective add-on with any scanning microscope, requiring only the availability of an extra input channel in the microscope electronics. We demonstrate here its implementation in combination with two-photon excited fluorescence (TPEF) microscopy and with coherent anti-Stokes Raman scattering (CARS) microscopy, applied to brain or spinal cord tissue imaging. In both cases, sOBM provides information on tissue morphology complementary to TPEF or CARS contrast. This information is obtained simultaneously and is automatically co-registered. Finally, we show that sOBM can be operated at video rate.

  9. Carbon-fiber tips for scanning probe microscopes and molecular electronics experiments

    NARCIS (Netherlands)

    Rubio-Bollinger, G.; Castellanos-Gomez, A.; Bilan, S.; Zotti, L.A.; Arroyo, C.R.; Agraït, N.; Cuevas, J.

    2012-01-01

    We fabricate and characterize carbon-fiber tips for their use in combined scanning tunneling and force microscopy based on piezoelectric quartz tuning fork force sensors. An electrochemical fabrication procedure to etch the tips is used to yield reproducible sub-100-nm apex. We also study electron

  10. Visualizing Morphological Changes of Abscission Zone Cells in Arabidopsis by Scanning Electron Microscope.

    Science.gov (United States)

    Shi, Chun-Lin; Butenko, Melinka A

    2018-01-01

    Scanning electron microscope (SEM) is a type of electron microscope which produces detailed images of surface structures. It has been widely used in plants and animals to study cellular structures. Here, we describe a detailed protocol to prepare samples of floral abscission zones (AZs) for SEM, as well as further image analysis. We show that it is a powerful tool to detect morphologic changes at the cellular level during the course of abscission in wild-type plants and to establish the details of phenotypic alteration in abscission mutants.

  11. Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope.

    Science.gov (United States)

    Kwon, Sangjin; Jeong, Hyun; Jeong, Mun Seok; Jeong, Sungho

    2011-08-01

    A backscattering type ultraviolet apertureless near-field scanning optical microscope (ANSOM) for the correlated measurement of topographical and optical characteristics of photonic materials with high optical resolution was developed. The near-field Rayleigh scattering image of GaN covered with periodic submicron Cr dots showed that optical resolution around 40 nm was achievable. By measuring the tip scattered photoluminescence of InGaN/GaN multi quantum wells, the applicability of the developed microscope for high resolution fluorescence measurement was also demonstrated.

  12. Dielectrophoretic positioning of single nanoparticles on atomic force microscope tips for tip-enhanced Raman spectroscopy.

    Science.gov (United States)

    Leiterer, Christian; Deckert-Gaudig, Tanja; Singh, Prabha; Wirth, Janina; Deckert, Volker; Fritzsche, Wolfgang

    2015-05-01

    Tip-enhanced Raman spectroscopy, a combination of Raman spectroscopy and scanning probe microscopy, is a powerful technique to detect the vibrational fingerprint of molecules at the nanometer scale. A metal nanoparticle at the apex of an atomic force microscope tip leads to a large enhancement of the electromagnetic field when illuminated with an appropriate wavelength, resulting in an increased Raman signal. A controlled positioning of individual nanoparticles at the tip would improve the reproducibility of the probes and is quite demanding due to usually serial and labor-intensive approaches. In contrast to commonly used submicron manipulation techniques, dielectrophoresis allows a parallel and scalable production, and provides a novel approach toward reproducible and at the same time affordable tip-enhanced Raman spectroscopy tips. We demonstrate the successful positioning of an individual plasmonic nanoparticle on a commercial atomic force microscope tip by dielectrophoresis followed by experimental proof of the Raman signal enhancing capabilities of such tips. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

  13. Probed adhesion force of living lung cells with a tip-modified atomic force microscope.

    Science.gov (United States)

    Fu, Wei-En; Sivashanmugan, Kundan; Liao, Jiunn-Der; Lin, Ying-Yi; Cheng, Kai-Hung; Liu, Bernard Haochih; Yan, Jun-Jer; Yeh, Ming-Hong

    2016-12-19

    The mechanical properties of the extracellular matrix play an important role in bio-microenvironment activities. Herein, atomic force microscope (AFM) was used to measure the interaction between Au and Ag nanoparticle (NP) clusters on the surface of human fetal lung cells. Using (3-mercapto-propyl) triethoxysilane (MPTMS), NP clusters were grafted onto the apex of AFM tip, and then, the adhesion force between the tip and the cell was analyzed. The measured adhesion force increased from 92 pN for AFM tip to 332 pN for that modified with MPTMS. The increase is most probably contributed by the nonspecific interactions between the apex of the modified AFM tip and the surface of the cells. The adhesion forces between the surface of NPs clusters grafted AFM tip and that of lung cells were dramatically reduced as NPs clusters were replaced by MPTMS. For the former, as the Au NPs cluster was applied, the adhesion force reached to 122 pN, whereas it significantly augmented with the addition of the cluster's size and dimension on the AFM tip. For the case of Ag cluster grafted on AFM tip, its adhesion force with the surface of the cells significantly lowered and reduced to 56 pN. Presumably, the electrostatic or van der Waals force between the two surfaces results in the variation of measurements. It is also very likely that the cell-surface interactions are probably varied by the nature of the contact surfaces, like the force-distance of attraction. The result is significant for understanding the the nature of the interactions between the surface of NPs and the membrane of lung cells.

  14. Photothermal excitation setup for a modified commercial atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Adam, Holger; Rode, Sebastian; Schreiber, Martin; Kühnle, Angelika, E-mail: kuehnle@uni-mainz.de [Institute of Physical Chemistry, Johannes Gutenberg University Mainz, Duesbergweg 10-14, 55099 Mainz (Germany); Kobayashi, Kei; Yamada, Hirofumi [Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo, Kyoto 615-8510 (Japan)

    2014-02-15

    High-resolution imaging in liquids using frequency modulation atomic force microscopy is known to suffer from additional peaks in the resonance spectrum that are unrelated to the cantilever resonance. These unwanted peaks are caused by acoustic modes of the liquid and the setup arising from the indirect oscillation excitation by a piezoelectric transducer. Photothermal excitation has been identified as a suitable method for exciting the cantilever in a direct manner. Here, we present a simple design for implementing photothermal excitation in a modified Multimode scan head from Bruker. Our approach is based on adding a few components only to keep the modifications as simple as possible and to maintain the low noise level of the original setup with a typical deflection noise density of about 15 fm/√(Hz) measured in aqueous solution. The success of the modification is illustrated by a comparison of the resonance spectra obtained with piezoelectric and photothermal excitation. The performance of the systems is demonstrated by presenting high-resolution images on bare calcite in liquid as well as organic adsorbates (Alizarin Red S) on calcite with simultaneous atomic resolution of the underlying calcite substrate.

  15. High-throughput atomic force microscopes operating in parallel

    Science.gov (United States)

    Sadeghian, Hamed; Herfst, Rodolf; Dekker, Bert; Winters, Jasper; Bijnagte, Tom; Rijnbeek, Ramon

    2017-03-01

    Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data collection can be an extremely lengthy process in AFM. The use of a single AFM instrument is known for its very low speed and not being suitable for scanning large areas, resulting in a very-low-throughput measurement. We address this challenge by parallelizing AFM instruments. The parallelization is achieved by miniaturizing the AFM instrument and operating many of them simultaneously. This instrument has the advantages that each miniaturized AFM can be operated independently and that the advances in the field of AFM, both in terms of speed and imaging modalities, can be implemented more easily. Moreover, a parallel AFM instrument also allows one to measure several physical parameters simultaneously; while one instrument measures nano-scale topography, another instrument can measure mechanical, electrical, or thermal properties, making it a lab-on-an-instrument. In this paper, a proof of principle of such a parallel AFM instrument has been demonstrated by analyzing the topography of large samples such as semiconductor wafers. This nanoinstrument provides new research opportunities in the nanometrology of wafers and nanolithography masks by enabling real die-to-die and wafer-level measurements and in cell biology by measuring the nano-scale properties of a large number of cells.

  16. Capillary force on a tilted cylinder: Atomic Force Microscope (AFM) measurements.

    Science.gov (United States)

    Kosgodagan Acharige, Sébastien; Laurent, Justine; Steinberger, Audrey

    2017-11-01

    The capillary force in situations where the liquid meniscus is asymmetric, such as the one around a tilted object, has been hitherto barely investigated even though these situations are very common in practice. In particular, the capillary force exerted on a tilted object may depend on the dipping angle i. We investigate experimentally the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an AFM cantilever of known stiffness, whose deflection is measured when the cylindrical probe is dipped in and retracted from reference liquids. We show that a torque correction is necessary to understand the measured deflection. We give the explicit expression of this correction as a function of the probes' geometrical parameters, so that its magnitude can be readily evaluated. The results are compatible with a vertical capillary force varying as 1/cosi, in agreement with a recent theoretical prediction. Finally, we discuss the accuracy of the method for measuring the surface tension times the cosine of the contact angle of the liquid on the probe. Copyright © 2017 Elsevier Inc. All rights reserved.

  17. Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process

    Science.gov (United States)

    Cui, Le; Marchand, Éric

    2015-04-01

    A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article. A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014. . Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.

  18. Depth sectioning with the aberration-corrected scanning transmission electron microscope

    Science.gov (United States)

    Borisevich, Albina Y.; Lupini, Andrew R.; Pennycook, Stephen J.

    2006-01-01

    The ability to correct the aberrations of the probe-forming lens in the scanning transmission electron microscope provides not only a significant improvement in transverse resolution but in addition brings depth resolution at the nanometer scale. Aberration correction therefore opens up the possibility of 3D imaging by optical sectioning. Here we develop a definition for the depth resolution for scanning transmission electron microscope depth sectioning and present initial results from this method. Objects such as catalytic metal clusters and single atoms on various support materials are imaged in three dimensions with a resolution of several nanometers. Effective focal depth is determined by statistical analysis and the contributing factors are discussed. Finally, current challenges and future capabilities available through new instruments are discussed. PMID:16492746

  19. Corrections of magnification and focusing in a cathode lens-equipped scanning electron microscope.

    Science.gov (United States)

    Zobacová, J; Zobac, M; Oral, M; Müllerová, I; Frank, L

    2006-01-01

    One of the well-proven and efficient methods of obtaining a very low-energy impact of primary electrons in the scanning electron microscope is to introduce a retarding field element below the pole piece of the objective lens (OL). It is advantageous to use the specimen alone as the negatively biased electrode (i.e., cathode of the cathode lens). The optical power of the cathode lens modifies some of the standard parameters of the image formation such as relation of working distance to OL excitation or magnification to the scanning coils current, the impact angle of primary electrons, and so forth. In computer-controlled electron microscopes these parameters, particularly with regard to focusing and magnification, can be corrected automatically. Derivation of algorithms for such corrections and their experimental verifications are presented in this paper. Furthermore, a more accurate analytical expression for the focal length of an aperture lens is derived.

  20. Application of nuclear particle tracks: A scanning x-ray microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ebert, P.J.

    1991-09-30

    The scanning x-ray microscope (SXM) is a short-wavelength analog of a near-field optical-scanning microscope, promising spatial resolution of {approximately}100{angstrom} up to {approximately}5 keV x-ray energy. A portion of a synchrotron x-ray beam streams through an etched nuclear particle track in an opaque membrane and impinges on an object within the narrow stream. Scattered or transmitted x-rays are detected with a photon counter. The SXM is feasible because a useful number of synchrotron x-rays, even from a bend magnet, will stream through a small diameter pore. The properties and limitations of the SXM are discussed together with other submicroscopic applications of nuclear particle tracks. 14 refs., 8 figs., 1 tab.

  1. A cryogenic scanning laser microscope for investigation of dynamical states in long Josephson junctions

    DEFF Research Database (Denmark)

    Holm, Jesper; Mygind, Jesper

    1995-01-01

    The first local oscillators based on moving magnetic flux quanta in long Josephson junctions are being developed for superconducting integrated quasi-optical SIS receivers. In order to further refine these oscillators one has to understand the complex dynamics of these devices. Since the local...... on measurements on different oscillator samples, performed with a novel Cryogenic Scanning Laser Microscope (CSLM) having a spatial resolution of less than ±2.5 μm over a 500 μm×50 μm wide scanning area in the temperature range 2 K-300 K. Even though the dynamical states are extremely sensitive to external noise...... this microscope enables us to make stable in-situ measurements on operating Josephson junctions. Recent results are presented and discussed....

  2. Optimal imaging techniques in the scanning transmission electron microscope: applications to biological macromolecules.

    Science.gov (United States)

    Ohtsuki, M; Crewe, A V

    1980-01-01

    We show applications of the optimal imaging method to stained biological macromolecules. This optimal imaging method involves the following basic procedures: (i) for any given resolution, which is represented by the electron probe size in the scanning transmission electron microscope, a preferred magnification is used; (ii) the micrographs taken at the condition described above are then spatially filtered by using a low-pass filter (nu < 1/2d, in which d is the space between scan lines) to optically reconstruct the final optimal image. It is found that the micrographs obtained by using the optimal imaging method clearly show an improvement in contrast. Images PMID:6933454

  3. Second-harmonic interference imaging of ferroelectric domains through a scanning microscope

    Science.gov (United States)

    Huang, Xiaoyang; Wei, Dunzhao; Wang, Yongmei; Zhu, Yunzhi; Zhang, Yong; Hu, X. P.; Zhu, S. N.; Xiao, Min

    2017-12-01

    We report a second-harmonic (SH) interference imaging technique to observe the ferroelectric domains of a periodically poled LiTaO3 crystal through a scanning microscope. By interfering with the reference SH field, which is produced in an un-poled LiTaO3 crystal, the SH imaging of the positive and negative domains can be easily distinguished. The image quality can be tuned by rotating the reference crystal or moving the focal plane. Our SH interference configuration is compatible with commercial scanning microscopy and has potential applications in fast examination of the ferroelectric structures in waveguide, film, and integrated devices.

  4. Magnification-continuous static calibration model of a scanning-electron microscope.

    OpenAIRE

    Malti, Abed Choaib; Dembélé, Sounkalo; Piat, Nadine; Rougeot, Patrick; Salut, Roland

    2012-01-01

    International audience; We present a new calibration model of both static distortion and projection for a scanning-electron microscope (SEM). The proposed calibration model depends continuously on the magnification factor. State-of-the-art methods have proposed models to solve the static distortion and projection model but for a discrete set of low and high magnifications: at low magnifications, existing models assume static distortion and perspective projection. At high magnifications, exist...

  5. Solving Research Tasks Using Desk top Scanning Electron Microscope Phenom ProX

    Directory of Open Access Journals (Sweden)

    Vertsanova, O.V.

    2014-03-01

    Full Text Available Phenom ProX — morden effective universal desktop Scanning Electron Microscope with integrated EDS system. Phenom-World helps customers to stay competitive in a world where critical dimensions are continuously getting smaller. All Phenom desktop systems give direct access to the high resolution and high-quality imaging and analysis required in a large variety of applications. They are affordable, flexible and a fast tool enabling engineers, technicians, researchers and educational professionals to investigate micron and submicron structures.

  6. Visible Light Emission from Atomic Scale Patterns Fabricated by the Scanning Tunneling Microscope

    DEFF Research Database (Denmark)

    Thirstrup, C.; Sakurai, M.; Stokbro, Kurt

    1999-01-01

    Scanning tunneling microscope (STM) induced light emission from artificial atomic scale structures comprising silicon dangling bonds on hydrogen-terminated Si(001) surfaces has been mapped spatially and analyzed spectroscopically in the visible spectral range. The light emission is based on a novel...... a quasipoint source with a spatial extension similar to the size of a dangling bond. [S0031-9007(98)08376-8]....

  7. Clinical and scanning electron microscopic assessments of porcelain and ceromer resin veneers.

    OpenAIRE

    Dhawan P; Prakash H; Shah N

    2003-01-01

    PURPOSE: Recently available Ceromer resin materials are promising for fabrication of esthetic anterior laminates and provices an alternative, cost effective treament modality to porcelain laminates for discolored anterior anterior teeth. It was proposed to study the esthetic quality and surface finish of veneers fbricated from ceromer resin and compare it with the standard porcelain veneers, both clinically as well as by scanning electron microscope (SEM) at baseline and at 12 months. If foun...

  8. Scanning Electron Microscopic Evaluation of Root Canal Irrigation with Saline, Sodium Hypochlorite, and Citric Acid,

    Science.gov (United States)

    1983-12-01

    endodontic techniques; citric acid for root canal irrigation 4410,ABSTACgmf --,-,m- ,-rms n roc"---’This Study used a scanning electron microscope and a...wall is instrumented during canal preparation and that the smeared layer seems to be found only where endodontic instruments have scraped the surface...between the extremes. It was also decided to use a magnification of 75X to evaluate the superficial debris and 800X to evaluate the smeared layer

  9. Differential phase microscope and micro-tomography with a Foucault knife-edge scanning filter

    Science.gov (United States)

    Watanabe, N.; Hashizume, J.; Goto, M.; Yamaguchi, M.; Tsujimura, T.; Aoki, S.

    2013-10-01

    An x-ray differential phase microscope with a Foucault knife-edge scanning filter was set up at the bending magnet source BL3C, Photon Factory. A reconstructed phase profile from the differential phase image of an aluminium wire at 5.36 keV was fairly good agreement with the numerical simulation. Phase tomography of a biological specimen, such as an Artemia cyst, could be successfully demonstrated.

  10. Intensity interferometry experiments in a scanning transmission electron microscope : physics and applications

    OpenAIRE

    Meuret, Sophie

    2015-01-01

    Quantum optics performed at the nanometer scale is an important challenge, especially for quantum emitters characterization. They can be point defects in material (few ang- ströms) or confined structures of a few nanometers. A way to reach this scale is by using cathodoluminescence (CL) performed in a scanning transmission electron microscope (CL- STEM), which has only recently been done [1]. However, when aiming at studying the statistical properties of the light coming out of a CL experimen...

  11. Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope

    OpenAIRE

    Marturi, Naresh

    2013-01-01

    With the latest advances in nanotechnology, it became possible to design novel nanoscale devicesand systems with increasing efficiency. The consequence of this fact is an increase in the need for developing reliable and cutting edge processes for nanomanipulation and nanocharacterization. Since the human direct sensing is not a feasible option at this particular scale, the tasks are usually performedby an expert human operator using a scanning electron microscope (SEM) equipped withmicro-nano...

  12. A landmark-based method for the geometrical 3D calibration of scanning microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Ritter, M.

    2007-04-27

    This thesis presents a new strategy and a spatial method for the geometric calibration of 3D measurement devices at the micro-range, based on spatial reference structures with nanometersized landmarks (nanomarkers). The new method was successfully applied for the 3D calibration of scanning probe microscopes (SPM) and confocal laser scanning microscopes (CLSM). Moreover, the spatial method was also used for the photogrammetric self-calibration of scanning electron microscopes (SEM). In order to implement the calibration strategy to all scanning microscopes used, the landmark-based principle of reference points often applied at land survey or at close-range applications has been transferred to the nano- and micro-range in the form of nanomarker. In order to function as a support to the nanomarkers, slope-shaped step pyramids have been developed and fabricated by focused ion beam (FIB) induced metal deposition. These FIB produced 3D microstructures have been sized to embrace most of the measurement volume of the scanning microscopes. Additionally, their special design allows the homogenous distribution of the nanomarkers. The nanomarkers were applied onto the support and the plateaus of the slope-step pyramids by FIB etching (milling) as landmarks with as little as several hundreds of nanometers in diameter. The nanomarkers are either of point-, or ring-shaped design. They are optimized so that they can be spatially measured by SPM and CLSM, and, imaged and photogrammetrically analyzed on the basis of SEM data. The centre of the each nanomarker serves as reference point in the measurement data or images. By applying image processing routines, the image (2D) or object (3D) coordinates of each nanomarker has been determined with subpixel accuracy. The correlative analysis of the SPM, CLSM and photogrammetric SEM measurement data after 3D calibration resulted in mean residues in the measured coordinates of as little as 13 nm. Without the coupling factors the mean

  13. The electrically detected magnetic resonance microscope: combining conductive atomic force microscopy with electrically detected magnetic resonance.

    Science.gov (United States)

    Klein, Konrad; Hauer, Benedikt; Stoib, Benedikt; Trautwein, Markus; Matich, Sonja; Huebl, Hans; Astakhov, Oleksandr; Finger, Friedhelm; Bittl, Robert; Stutzmann, Martin; Brandt, Martin S

    2013-10-01

    We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8×10(6)spins/√Hz at room temperature.

  14. An open source/real-time atomic force microscope architecture to perform customizable force spectroscopy experiments.

    Science.gov (United States)

    Materassi, Donatello; Baschieri, Paolo; Tiribilli, Bruno; Zuccheri, Giampaolo; Samorì, Bruno

    2009-08-01

    We describe the realization of an atomic force microscope architecture designed to perform customizable experiments in a flexible and automatic way. Novel technological contributions are given by the software implementation platform (RTAI-LINUX), which is free and open source, and from a functional point of view, by the implementation of hard real-time control algorithms. Some other technical solutions such as a new way to estimate the optical lever constant are described as well. The adoption of this architecture provides many degrees of freedom in the device behavior and, furthermore, allows one to obtain a flexible experimental instrument at a relatively low cost. In particular, we show how such a system has been employed to obtain measures in sophisticated single-molecule force spectroscopy experiments [Fernandez and Li, Science 303, 1674 (2004)]. Experimental results on proteins already studied using the same methodologies are provided in order to show the reliability of the measure system.

  15. Tip Effect of the Tapping Mode of Atomic Force Microscope in Viscous Fluid Environments.

    Science.gov (United States)

    Shih, Hua-Ju; Shih, Po-Jen

    2015-07-28

    Atomic force microscope with applicable types of operation in a liquid environment is widely used to scan the contours of biological specimens. The contact mode of operation allows a tip to touch a specimen directly but sometimes it damages the specimen; thus, a tapping mode of operation may replace the contact mode. The tapping mode triggers the cantilever of the microscope approximately at resonance frequencies, and so the tip periodically knocks the specimen. It is well known that the cantilever induces extra liquid pressure that leads to drift in the resonance frequency. Studies have noted that the heights of protein surfaces measured via the tapping mode of an atomic force microscope are ~25% smaller than those measured by other methods. This discrepancy may be attributable to the induced superficial hydrodynamic pressure, which is worth investigating. In this paper, we introduce a semi-analytical method to analyze the pressure distribution of various tip geometries. According to our analysis, the maximum hydrodynamic pressure on the specimen caused by a cone-shaped tip is ~0.5 Pa, which can, for example, pre-deform a cell by several nanometers in compression before the tip taps it. Moreover, the pressure calculated on the surface of the specimen is 20 times larger than the pressure without considering the tip effect; these results have not been motioned in other papers. Dominating factors, such as surface heights of protein surface, mechanical stiffness of protein increasing with loading velocity, and radius of tip affecting the local pressure of specimen, are also addressed in this study.

  16. SCANNING ELECTRON MICROSCOPIC INVESTIGATION OF DENTINAL TUBULES IN MONKEY DENTIN SCANNING ELECTRON MICROSCOPIC INVESTIGATION OF DENTINAL TUBULES IN Cebus apella DENTIN

    Directory of Open Access Journals (Sweden)

    João Humberto Antoniazzi

    2009-12-01

    Full Text Available

    The aim of the study was to investigate the number and diameter of the Cebus apella dentinal tubules. The roots of the Cebus apella teeth were examined in specific tooth locations: the apical, middle and cervical dentin. The calculations were based on the scanning electron microscope photographs of the fractured surfaces. The results showed that the average number of dentinal tubules for each location was: 74,800 tubules/mm2 for apical root dentin, 90,000 tubules/mm2 for mid-root dentin, 91,600 tubules/mm2 for cervical root dentin. The average diameter was the following: apical root dentin, 4,30µm; mid-root dentin, 4,37µm; cervical root dentin,  5,23µm. These findings demonstrate that the Cebus apella teeth are a suitable substitute for human in endodontics studies. 

    KEY WORDS: Dentin, dentinal tubules, teeth.
    The aim of the study was to investigate the number and diameter of the Cebus apella dentinal tubules. The roots of the Cebus apella teeth were examined in specific tooth locations: the apical, middle and cervical dentin. The calculations were based on the scanning electron microscope photographs of the fractured surfaces. The results showed that the average number of dentinal tubules for each location was: 74,800 tubules/mm2 for apical root dentin, 90,000 tubules/mm2 for mid-root dentin, 91,600 tubules/mm2 for cervical root dentin. The average diameter was the following: apical root dentin, 4,30µm; mid-root dentin, 4,37µm; cervical root dentin,  5,23µm. These findings demonstrate that the Cebus apella teeth are a suitable substitute for human in endodontics studies. 

    KEY WORDS: Dentin, dentinal tubules, teeth.

  17. Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

    KAUST Repository

    Kwek, Jin Wang

    2011-07-01

    A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday\\'s pail technique. © 2011 Elsevier B.V.

  18. Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface.

    Science.gov (United States)

    Leinen, Philipp; Green, Matthew F B; Esat, Taner; Wagner, Christian; Tautz, F Stefan; Temirov, Ruslan

    2016-10-02

    Considering organic molecules as the functional building blocks of future nanoscale technology, the question of how to arrange and assemble such building blocks in a bottom-up approach is still open. The scanning probe microscope (SPM) could be a tool of choice; however, SPM-based manipulation was until recently limited to two dimensions (2D). Binding the SPM tip to a molecule at a well-defined position opens an opportunity of controlled manipulation in 3D space. Unfortunately, 3D manipulation is largely incompatible with the typical 2D-paradigm of viewing and generating SPM data on a computer. For intuitive and efficient manipulation we therefore couple a low-temperature non-contact atomic force/scanning tunneling microscope (LT NC-AFM/STM) to a motion capture system and fully immersive virtual reality goggles. This setup permits "hand controlled manipulation" (HCM), in which the SPM tip is moved according to the motion of the experimenter's hand, while the tip trajectories as well as the response of the SPM junction are visualized in 3D. HCM paves the way to the development of complex manipulation protocols, potentially leading to a better fundamental understanding of nanoscale interactions acting between molecules on surfaces. Here we describe the setup and the steps needed to achieve successful hand-controlled molecular manipulation within the virtual reality environment.

  19. Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope

    Science.gov (United States)

    de Jonge, Niels [Oak Ridge, TN

    2010-08-17

    A confocal scanning transmission electron microscope which includes an electron illumination device providing an incident electron beam propagating in a direction defining a propagation axis, and a precision specimen scanning stage positioned along the propagation axis and movable in at least one direction transverse to the propagation axis. The precision specimen scanning stage is configured for positioning a specimen relative to the incident electron beam. A projector lens receives a transmitted electron beam transmitted through at least part of the specimen and focuses this transmitted beam onto an image plane, where the transmitted beam results from the specimen being illuminated by the incident electron beam. A detection system is placed approximately in the image plane.

  20. Controlling chaos in dynamic-mode atomic force microscope

    OpenAIRE

    Yamasue, Kohei; Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi; Hikihara, Takashi

    2009-01-01

    We successfully demonstrated the first experimental stabilization of irregular and non-periodic cantilever oscillation in the amplitude modulation atomic force microscopy using the time-delayed feedback control. A perturbation to cantilever excitation force stabilized an unstable periodic orbit associated with nonlinear cantilever dynamics. Instead of the typical piezoelectric excitation, the magnetic excitation was used for directly applying control force to the cantilever. The control force...

  1. Scanning transmission x-ray microscope for materials science spectromicroscopy at the ALS

    Energy Technology Data Exchange (ETDEWEB)

    Warwick, T.; Seal, S.; Shin, H. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)] [and others

    1997-04-01

    The brightness of the Advanced Light Source will be exploited by several new instruments for materials science spectromicroscopy over the next year or so. The first of these to become operational is a scanning transmission x-ray microscope with which near edge x-ray absorption spectra (NEXAFS) can be measured on spatial features of sub-micron size. Here the authors describe the instrument as it is presently implemented, its capabilities, some studies made to date and the developments to come. The Scanning Transmission X-ray Microscope makes use of a zone plate lens to produce a small x-ray spot with which to perform absorption spectroscopy through thin samples. The x-ray beam from ALS undulator beamline 7.0 emerges into the microscope vessel through a silicon nitride vacuum window 160nm thick and 300{mu}m square. The vessel is filled with helium at atmospheric pressure. The zone plate lens is illuminated 1mm downstream from the vacuum window and forms an image in first order of a pinhole which is 3m upstream in the beamline. An order sorting aperture passes the first order converging light and blocks the unfocused zero order. The sample is at the focus a few mm downstream of the zone plate and mounted from a scanning piezo stage which rasters in x and y so that an image is formed, pixel by pixel, by an intensity detector behind the sample. Absorption spectra are measured point-by-point as the photon energy is scanned by rotating the diffraction grating in the monochromator and changing the undulator gap.

  2. Microscopical characterization of known postmortem root bands using light and scanning electron microscopy.

    Science.gov (United States)

    Hietpas, Jack; Buscaglia, JoAnn; Richard, Adam H; Shaw, Stephen; Castillo, Hilda S; Donfack, Joseph

    2016-10-01

    A postmortem root band (PMRB) is a distinct microscopic feature that is postulated to occur in hair remaining in the follicle during the postmortem interval [1] (Petraco et al., 1998). The scientific validity of this premise has been highlighted in two recent high-profile criminal cases involving PMRBs [2,3] (State of Florida v. Casey Marie Anthony, 2008; People v. Kogut, 2005). To better understand the fundamental aspects of postmortem root banding, the microscopical properties of known PMRBs(1) were characterized by light microscopy, and scanning electron microscope (SEM) imaging of microtomed sections of hairs showing root banding. The results from this study show that the appearance of the PMRB may be due to the degradation of the chemically labile, non-keratin intermacrofibrillar matrix (IMM) in the pre-keratin/keratogenous region of anagen hairs. In addition, this degradation is confined to the cortex of the hair, with no apparent damage to the layers of the cuticle. These results could provide valuable information for determining the mechanism of band formation, as well as identify a set of microscopic features that could be used to distinguish hairs with known PMRBs from similarly looking environmentally degraded hairs. Published by Elsevier Ireland Ltd.

  3. Identification of mycobacterium tuberculosis in sputum smear slide using automatic scanning microscope

    Science.gov (United States)

    Rulaningtyas, Riries; Suksmono, Andriyan B.; Mengko, Tati L. R.; Saptawati, Putri

    2015-04-01

    Sputum smear observation has an important role in tuberculosis (TB) disease diagnosis, because it needs accurate identification to avoid high errors diagnosis. In development countries, sputum smear slide observation is commonly done with conventional light microscope from Ziehl-Neelsen stained tissue and it doesn't need high cost to maintain the microscope. The clinicians do manual screening process for sputum smear slide which is time consuming and needs highly training to detect the presence of TB bacilli (mycobacterium tuberculosis) accurately, especially for negative slide and slide with less number of TB bacilli. For helping the clinicians, we propose automatic scanning microscope with automatic identification of TB bacilli. The designed system modified the field movement of light microscope with stepper motor which was controlled by microcontroller. Every sputum smear field was captured by camera. After that some image processing techniques were done for the sputum smear images. The color threshold was used for background subtraction with hue canal in HSV color space. Sobel edge detection algorithm was used for TB bacilli image segmentation. We used feature extraction based on shape for bacilli analyzing and then neural network classified TB bacilli or not. The results indicated identification of TB bacilli that we have done worked well and detected TB bacilli accurately in sputum smear slide with normal staining, but not worked well in over staining and less staining tissue slide. However, overall the designed system can help the clinicians in sputum smear observation becomes more easily.

  4. Development of a scanning nearfield optical microscope for low-temperature investigations of semiconductor nanostructures

    Energy Technology Data Exchange (ETDEWEB)

    Hodeck, Kai Friedrich

    2009-02-19

    In the present work the electronic structure of MOCVD-grown InGaAs/GaAs and InAs/GaAs quantum dots which are characterized by a particularly low ground state transition energy, was investigated using Scanning Nearfield Optical Microscopy (SNOM). The pivotal question of the presented investigations is, which influence the interaction of the confined carriers has on the energy states of the biexcitons and the multiexcitons in a quantum dot. Therefore, photoluminescence spectra of single quantum dots were investigated under varying excitation intensity at different temperatures between 5 K and 300 K. The construction of a novel scanning nearfield microscope especially for low temperatures allowed the investigation of single quantum dots. Due to significant improvements of the positioning technology and the shear-force distance control between the sample and the nearfield probe a stable scanning of the quantum dot samples at 5 K could be demonstrated, showing a lateral optical resolution of 200 nm. This way, in the photoluminescence spectroscopy of single quantum dots the thermal linewidth broadening of the detected light was reduced down to a value of less than 1 meV, which allowed the identification of the transitions of biexcitons and multiexcitons. On the basis of the performed measurements, for the InGaAs/GaAs quantum dots a biexciton state was identified, with variable binding energies of 2-7 meV. Furthermore, a positively charged trion state with a binding energy of 11 meV was observed, showing high emission intensity, which can be assigned to the sample doping. Accordingly, for the positively charged biexciton state a binding energy of 11 meV can be announced. For the investigated InAs/GaAs quantum dots a biexciton state with binding energies of 3-4 meV was found. Some of the investigated InAs/GaAs quantum dots showed the formation of positively charged states, in particular of a trion state with a binding energy of 3 meV, and of the positively charged

  5. Revealing the 1 nm/s Extensibility of Nanoscale Amorphous Carbon in a Scanning Electron Microscope

    DEFF Research Database (Denmark)

    Zhang, Wei

    2013-01-01

    In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformati...... positive implications to explore some amorphous carbon as electron field emission device. SCANNING 35: 261-264, 2013. © 2012 Wiley Periodicals, Inc.......In an ultra-high vacuum scanning electron microscope, the edged branches of amorphous carbon film (∼10 nm thickness) can be continuously extended with an eye-identifying speed (on the order of ∼1 nm/s) under electron beam. Such unusual mobility of amorphous carbon may be associated with deformation...... promoted by the electric field, which resulted from an inner secondary electron potential difference from the main trunk of carbon film to the tip end of branches under electron beam. This result demonstrates importance of applying electrical effects to modify properties of carbon materials. It may have...

  6. Ultra-Compact Multitip Scanning Probe Microscope with an Outer Diameter of 50 mm

    Science.gov (United States)

    Cherepanov, Vasily; Zubkov, Evgeny; Junker, Hubertus; Korte, Stefan; Blab, Marcus; Coenen, Peter; Voigtländer, Bert

    We present a multitip scanning tunneling microscope (STM) where four independent STM units are integrated on a diameter of 50 mm. The coarse positioning of the tips is done under the control of an optical microscope or an SEM in vacuum. The heart of this STM is a new type of piezoelectric coarse approach called Koala Drive which can have a diameter greater than 2.5 mm and a length smaller than 10 mm. Alternating movements of springs move a central tube which holds the STM tip or AFM sensor. This new operating principle provides a smooth travel sequence and avoids shaking which is intrinsically present for nanopositioners based on inertial motion with saw tooth driving signals. Inserting the Koala Drive in a piezo tube for xyz-scanning integrates a complete STM inside a 4 mm outer diameter piezo tube of Koala Drive makes the scanning probe microscopy design ultra-compact and accordingly leads to a high mechanical stability. The drive is UHV, low temperature, and magnetic field compatible. The compactness of the Koala Drive allows building a four-tip STM as small as a single-tip STM with a drift of Koala Drive.

  7. Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope

    Science.gov (United States)

    Nazaretski, E.; Kim, Jungdae; Yan, H.; Lauer, K.; Eom, D.; Shu, D.; Maser, J.; Pešić, Z.; Wagner, U.; Rau, C.; Chu, Y. S.

    2013-03-01

    Synchrotron based x-ray microscopy established itself as a prominent tool for noninvasive investigations in many areas of science and technology. Many facilities around the world routinely achieve sub-micrometer resolution with a few instruments capable of imaging with the spatial resolution better than 100 nm. With an ongoing effort to push the 2D/3D resolution down to 10 nm in the hard x-ray regime both fabrication of the nano-focusing optics and stability of a microscope become extremely challenging. In this work we present our approach to overcome technical challenges on the path towards high spatial resolution hard x-ray microscopy and demonstrate the performance of a scanning fluorescence microscope equipped with the multilayer Laue lenses focusing optics.

  8. Frequency-doubled Alexandrite laser for use in periodontology: a scanning electron microscopic investigation

    Science.gov (United States)

    Rechmann, Peter; Hennig, Thomas

    1996-12-01

    During prior studies it could be demonstrated that engaging a frequency double Alexandrite-laser allows a fast and strictly selective ablation of supra- and subgingival calculus. Furthermore, the removal of unstained microbial plaque was observed. First conclusions were drawn following light microscopic investigations on undecalcified sections of irradiated teeth. In the present study the cementum surface after irradiation with a frequency doubled Alexandrite-laser was observed by means of a scanning electron microscope. After irradiation sections of teeth were dried in alcohol and sputtered with gold. In comparison irradiated cementum surfaces of unerupted operatively removed wisdom teeth and tooth surfaces after the selective removal of calculus were investigated. A complete removal of calculus was observed as well as a remaining smooth surface of irradiated cementum.

  9. A Cost-Effective Atomic Force Microscope for Undergraduate Control Laboratories

    Science.gov (United States)

    Jones, C. N.; Goncalves, J.

    2010-01-01

    This paper presents a simple, cost-effective and robust atomic force microscope (AFM), which has been purposely designed and built for use as a teaching aid in undergraduate controls labs. The guiding design principle is to have all components be open and visible to the students, so the inner functioning of the microscope has been made clear to…

  10. Construction of a Dual-Tip Scanning Tunneling Microscope: a Prototype Nanotechnology Workstation.

    Science.gov (United States)

    Voelker, Mark Alan

    1993-01-01

    This dissertation describes the construction and performance of a dual-tip scanning tunneling microscope (STM). The microscope was built as a prototype nanotechnology workstation, a general purpose instrument designed to give a researcher the ability to investigate and manipulate nanometer scale structures. Chapter One describes the genesis and development of the concept of nanotechnology, from the atomic hypothesis of Democritus to modern developments in synthetic chemistry. Nanometer scale electronics (molecular electronics) is introduced and the state of the art in this field is described. The dual-tip scanning probe microscope is proposed as a way to address individual molecular electronic devices, a key goal in realizing nanometer scale electronic technology. Investigation of microtubules, a proposed nanometer scale intracellular biological information processing system, is also discussed. Chapter Two reviews the history and fundamental physics of STM, along with the related techniques of Field Ion Microscopy (FIM) and Ballistic Electon Emission Microscopy (BEEM). BEEM is used to introduce the physics of the dual -tip STM. Other dual-probe systems are also described. Chapter Three covers the design and construction of the dual-tip STM. Both hardware and software are described in detail. Chapter Four presents the results obtained with the dual-tip STM, including dual-tip images and noise measurements for the electronic circuitry. The last chapter, Chapter Five, contains suggested design changes for improving the performance of the dual -tip microscope and descriptions of experiments that can be performed with an improved instrument. Design and use of a nanotechnology workstation in the fields of semiconductor electronics, molecular electronics and cellular biology is discussed. Investigation of neurons grown on a silicon chip with a dual-tip STM system is proposed. Four Appendices present a noise model of the STM tunneling gap and preamplifier, describe

  11. Contact force and scanning velocity during active roughness perception.

    Directory of Open Access Journals (Sweden)

    Yoshihiro Tanaka

    Full Text Available Haptic perception is bidirectionally related to exploratory movements, which means that exploration influences perception, but perception also influences exploration. We can optimize or change exploratory movements according to the perception and/or the task, consciously or unconsciously. This paper presents a psychophysical experiment on active roughness perception to investigate movement changes as the haptic task changes. Exerted normal force and scanning velocity are measured in different perceptual tasks (discrimination or identification using rough and smooth stimuli. The results show that humans use a greater variation in contact force for the smooth stimuli than for the rough stimuli. Moreover, they use higher scanning velocities and shorter break times between stimuli in the discrimination task than in the identification task. Thus, in roughness perception humans spontaneously use different strategies that seem effective for the perceptual task and the stimuli. A control task, in which the participants just explore the stimuli without any perceptual objective, shows that humans use a smaller contact force and a lower scanning velocity for the rough stimuli than for the smooth stimuli. Possibly, these strategies are related to aversiveness while exploring stimuli.

  12. Flexible polygon-mirror based laser scanning microscope platform for multiphoton in-vivo imaging.

    Science.gov (United States)

    Li, Y X; Gautam, V; Brüstle, A; Cockburn, I A; Daria, V R; Gillespie, C; Gaus, K; Alt, C; Lee, W M

    2017-11-01

    Commercial microscopy systems make use of tandem scanning i.e. either slow or fast scanning. We constructed, for the first time, an advanced control system capable of delivering a dynamic line scanning speed ranging from 2.7 kHz to 27 kHz and achieve variable frame rates from 5 Hz to 50 Hz (512 × 512). The dynamic scanning ability is digitally controlled by a new customized open-source software named PScan1.0. This permits manipulation of scanning rates either to gain higher fluorescence signal at slow frame rate without increasing laser power or increase frame rates to capture high speed events. By adjusting imaging speed from 40 Hz to 160 Hz, we capture a range of calcium waves and transient peaks from soma and dendrite of single fluorescence neuron (CAL-520AM). Motion artifacts arising from respiratory and cardiac motion in small animal imaging reduce quality of real-time images of single cells in-vivo. An image registration algorithm, integrated with PScan1.0, was shown to perform both real time and post-processed motion correction. The improvement is verified by quantification of blood flow rates. This work describes all the steps necessary to develop a high performance and flexible polygon-mirror based multiphoton microscope system for in-vivo biological imaging. © 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

  13. Microscopic derivation of macroscopic Van der Waals forces

    NARCIS (Netherlands)

    Renne, M.J.; Nijboer, B.R.A.

    1967-01-01

    For a general system of isotropic harmonic oscillators with non-retarded dipole interaction a formula for the interatomic forces is derived. It is used to give an atomistic derivation of macroscopic Van der Waals forces in terms of the dielectric constant.

  14. [Scanning electron microscopic observations on the copulatory spicules of the male Necator americanus and Ancylostoma duodenale].

    Science.gov (United States)

    Xu, S E; Lu, X J; Xie, L C; Zhang, D P

    1993-01-01

    Scanning electron microscopic observations were made on the morphological structures of the two copulatory spicules of the male Necator americanus and Ancylostoma duodenale. In both species, one of the two copulatory spicules was in the shape of a concave groove and the other, in the shape of an oblate tube. Owing to the difference in the concavity of the groove shaped copulatory spicule between the two species as shown by the cross sections, Necator americanus usually appear to have only one copulatory spicule whereas Ancylostoma duodenale usually show two separate copulatory spicules in appearance (Figs 1-10).

  15. Unveiling the Mysteries of Mars with a Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM)

    Science.gov (United States)

    Edmunson, J.; Gaskin, J. A.; Doloboff, I. J.; Jerman, G.

    2017-01-01

    Development of a miniaturized scanning electron microscope that will utilize the martian atmosphere to dissipate charge during analysis continues. This instrument is expected to be used on a future rover or lander to answer fundamental Mars science questions. To identify the most important questions, a survey was taken at the 47th Lunar and Planetary Science Conference (LPSC). From the gathered information initial topics were identified for a SEM on the martian surface. These priorities are identified and discussed below. Additionally, a concept of operations is provided with the goal of maximizing the science obtained with the minimum amount of communication with the instrument.

  16. PRISMLESS ENAMEL IN HUMAN NON-ERUPTED DECIDUOUS MOLAR TEETH: A SCANNING ELECTRON MICROSCOPIC STUDY

    Directory of Open Access Journals (Sweden)

    FAVA Marcelo

    1997-01-01

    Full Text Available The frequency, structure and thickness of the prismless enamel layer in the buccal and lingual surfaces of non-erupted deciduous molar teeth were described. The teeth were extracted, kept in a 70% ethanol solution, dried, coated with gold and examined in a scanning electron microscope JEOL, JSM-6.100. The aprismatic layer was observed in the occlusal, middle and cervical thirds of all buccal and lingual surfaces. The hydroxyapatite crystals were arranged parallel to each other and perpendicular to the enamel surface. No statistically significant differences were observed between the occlusal, middle and cervical thirds, which had 7.257 m m of average thickness.

  17. SLAM examination of solar cells and solar cell welds. [Scanning Laser Acoustic Microscope

    Science.gov (United States)

    Stella, P. M.; Vorres, C. L.; Yuhas, D. E.

    1981-01-01

    The scanning laser acoustic microscope (SLAM) has been evaluated for non-destructive examination of solar cells and interconnector bonds. Using this technique, it is possible to view through materials in order to reveal regions of discontinuity such as microcracks and voids. Of particular interest is the ability to evaluate, in a unique manner, the bonds produced by parallel gap welding. It is possible to not only determine the area and geometry of the bond between the tab and cell, but also to reveal any microcracks incurred during the welding. By correlating the SLAM results with conventional techniques of weld evaluation a more confident weld parameter optimization can be obtained.

  18. Transient measurements with an ultrafast scanning tunneling microscope on semiconductor surfaces

    DEFF Research Database (Denmark)

    Keil, Ulrich Dieter Felix; Jensen, Jacob Riis; Hvam, Jørn Märcher

    1998-01-01

    We demonstrate: the use of an ultrafast scanning tunneling microscope on a semiconductor surface. Laser-induced transient signals with 1.8 ps rise time are detected, The investigated sample is a low-temperature grown GaAs layer plated on a sapphire substrate with a thin gold layer that serves as st...... by the nonuniform carrier density created by the absorption of the light (photo Dember effect). The transient depends in sign and in shape on the direction of optical excitation. This signal is the dominating transient in tunneling mode. The signals are explained by a capacitive coupling across the tunneling gap...

  19. Optical microscope illumination analysis using through-focus scanning optical microscopy.

    Science.gov (United States)

    Attota, Ravi Kiran; Park, Haesung

    2017-06-15

    Misalignment of the aperture diaphragm present in optical microscopes results in angular illumination asymmetry (ANILAS) at the sample plane. Here we show that through-focus propagation of ANILAS results in a lateral image shift with a focus position. This could lead to substantial errors in quantitative results for optical methods that use through-focus images such as three-dimensional nanoparticle tracking, confocal microscopy, and through-focus scanning optical microscopy (TSOM). A correlation exists between ANILAS and the slant in TSOM images. Hence, the slant in the TSOM image can be used to detect, analyze, and rectify the presence of ANILAS.

  20. Note: Automated electrochemical etching and polishing of silver scanning tunneling microscope tips.

    Science.gov (United States)

    Sasaki, Stephen S; Perdue, Shawn M; Rodriguez Perez, Alejandro; Tallarida, Nicholas; Majors, Julia H; Apkarian, V Ara; Lee, Joonhee

    2013-09-01

    Fabrication of sharp and smooth Ag tips is crucial in optical scanning probe microscope experiments. To ensure reproducible tip profiles, the polishing process is fully automated using a closed-loop laminar flow system to deliver the electrolytic solution to moving electrodes mounted on a motorized translational stage. The repetitive translational motion is controlled precisely on the μm scale with a stepper motor and screw-thread mechanism. The automated setup allows reproducible control over the tip profile and improves smoothness and sharpness of tips (radius 27 ± 18 nm), as measured by ultrafast field emission.

  1. A scanning tunneling microscope break junction method with continuous bias modulation.

    Science.gov (United States)

    Beall, Edward; Yin, Xing; Waldeck, David H; Wierzbinski, Emil

    2015-09-28

    Single molecule conductance measurements on 1,8-octanedithiol were performed using the scanning tunneling microscope break junction method with an externally controlled modulation of the bias voltage. Application of an AC voltage is shown to improve the signal to noise ratio of low current (low conductance) measurements as compared to the DC bias method. The experimental results show that the current response of the molecule(s) trapped in the junction and the solvent media to the bias modulation can be qualitatively different. A model RC circuit which accommodates both the molecule and the solvent is proposed to analyze the data and extract a conductance for the molecule.

  2. Molecular images and vibrational spectroscopy of sorbic acid with the scanning tunneling microscope

    Science.gov (United States)

    Smith, Douglas P. E.; Kirk, Michael D.; Quate, Calvin F.

    1987-06-01

    Images of sorbic acid molecules absorbed onto graphite have been taken with a scanning tunneling microscope (STM) operating in liquid helium. Molecular clusters were clearly observed, as was the atomic structure of the graphite substrate. The molecules were seen to diffuse across the substrate at a rate of about 1 Å/min. When dI/dV vs V was measured with the STM probe directly over a sorbic acid molecule, a well-defined spectrum of peaks was obtained whose energies corresponded to the vibrational resonances of the molecule. Large changes in the spectra occurred if the tip was moved a lateral distance of 5 Å.

  3. Nanotubular Structure on the Ti-29Nb-5Zr Alloy by Scanning Transmission Electron Microscope.

    Science.gov (United States)

    Kim, Eun-Ju; Jeong, Yong-Hoon; Kang, Bo-An; Choe, Han-Cheol

    2015-01-01

    In this study, we reported the observation of highly ordered nanotubular structure on the Ti-29Nb-5Zr alloy in various potentials and electrolytes by field emission scanning electron microscopy and scanning transmission electron microscope. From the X-ray diffraction results and microstructure analysis, Ti-29Nb-5Zr alloy had β phase. The nanotube morphologies of Ti-29Nb-5Zr alloy were transformed from nano-porous structure to nanotube structure as NaF concentration and voltage increased. Nanotube diameter and layer changed with different concentration of NaF in 1 M H3PO4 at the same voltage. From the X-ray photoelectron spectroscopy results, nanotube was formed by Nb, Zr, and Ti oxide. Also, barrier layer of large tube was about 50 nm thickness, small one was 60 nm thickness. The nanotube size and crystallinity on the β Ti alloy was controlled by fluoride concentration, applied potential, anodization time, and tube layer.

  4. Observation of nanostructure by scanning near-field optical microscope with small sphere probe

    Directory of Open Access Journals (Sweden)

    Yasushi Oshikane, Toshihiko Kataoka, Mitsuru Okuda, Seiji Hara, Haruyuki Inoue and Motohiro Nakano

    2007-01-01

    Full Text Available Step and terrace structure has been observed in an area of 1 μm×1 μm on the cleaved surface of KCl–KBr solid-solution single crystal by scanning near-field optical microscope (SNOM with a small sphere probe of 500 nm diameter. Lateral spatial resolution of the SNOM system was estimated to be 20 nm from the observation of step width and the scanning-step interval. Vertical spatial resolution was estimated to be 5–2 nm from the observation of step height and noise level of photomultiplier tube (PMT. With applying a dielectric dipole radiation model to the probe surface, the reason why such a high spatial resolution was obtained in spite of the 500 nm sphere probe, was understood as the effect of the near-field term appeared in the radiation field equations.

  5. Examination of mycological samples by means of the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M. Thibaut

    1973-04-01

    Full Text Available Three species of Siphomycetes: Rhizopus arhizus, Rhizopus equinus and Rhizopus nigricans, as well as a Septomycete: Emericella nidulans, have been examined by means of a scanning electron microscope. Among the difjerent Rhizopus, this technique showed differences in the appearance of the sporangia. In Emericella nidulans, scanning microscopy enábled one to ascertain that the "Hull cells" were completely hollow and also demonstrated the ornemented aspect of the ascospores.Três espécies de Sifomicetas: Rhizopus arhizus, Rhizopus equinus, Rhizopus nigricans e um Septomiceta: Emericella nidulans foram examinados em microscopia de exploração. Esta técnica mostrou detalhes não evidenciáveis ao poder de resolução do microscópio óptico, demonstrando ser útil para o diagnóstico em micologia.

  6. Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Naresh-Kumar, G.; Hourahine, B.; Trager-Cowan, C. [Department of Physics, SUPA, University of Strathclyde, Glasgow (United Kingdom); Vilalta-Clemente, A.; Ruterana, P. [CIMAP UMR 6252 CNRS-ENSICAEN-CEA-UCBN, 6, Caen (France); Gamarra, P.; Lacam, C.; Tordjman, M.; Di Forte-Poisson, M.A. [Thales Research and Technology, III-V Lab, Marcoussis (France); Parbrook, P.J. [Department of Electrical and Electronic Engineering, University of Sheffield (United Kingdom); Day, A.P. [Aunt Daisy Scientific Ltd., Claremont House, High St, Lydney (United Kingdom); England, G. [K. E. Developments Ltd., Cambridge (United Kingdom)

    2012-03-15

    We describe the use of electron channelling contrast imaging (ECCI) - in a field emission scanning electron microscope (SEM) - to reveal and identify defects in nitride semiconductor thin films. In ECCI changes in crystallographic orientation, or changes in lattice constant due to local strain, are revealed by changes in grey scale in an image constructed by monitoring the intensity of backscattered electrons (BSEs) as an electron beam is scanned over a suitably oriented sample. Extremely small orientation changes are detectable, enabling small angle tilt and rotation boundaries and dislocations to be imaged. Images with a resolution of tens of nanometres are obtainable with ECCI. In this paper, we describe the use of ECCI with TEM to determine threading dislocation densities and types in InAlN/GaN heterostructures grown on SiC and sapphire substrates. (Copyright copyright 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  7. Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis

    Science.gov (United States)

    Hong, S.; Onushkin, G.; Park, J. S.; Kim, B. K.; Lee, D.-Y.; Fomin, A.; Ko, K.; Kim, J. W.

    2007-02-01

    We report new type of micro-EL instrument and its applications for light emitting devices. Our new micro-EL, so-called confocal scanning electroluminescence sprctro-microscope (CSESM) has not only fast image acquisition time but also high image resolution. The newly developed CSESM is combined with confocal laser scanning photoluminescence micsoscope, i.e. micro-PL. Therefore, micro-EL distribution can be directly matched with micro-PL and mechanical chip structure of LED. It is fruitful for providing a fast and non-destructive method to analyze the homogeneity of LEDs in its completely proceeded form. Using this apparatus, we study local intensity and wavelength distribution of electroluminescence for InGaN/GaN blue LED chip. Our results represent that local fluctuations of electroluminescence intensity and wavelength position are closely connected with the fluctuation of local current density, i.e. current spreading features on LED chips.

  8. Two-probe atomic-force microscope manipulator and its applications.

    Science.gov (United States)

    Zhukov, A A; Stolyarov, V S; Kononenko, O V

    2017-06-01

    We report on a manipulator based on a two-probe atomic force microscope (AFM) with an individual feedback system for each probe. This manipulator works under an upright optical microscope with 3 mm focal distance. The design of the microscope helps us tomanipulate nanowires using the microscope probes as a two-prong fork. The AFM feedback is realized based on the dynamic full-time contact mode. The applications of the manipulator and advantages of its two-probe design are presented.

  9. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

    Energy Technology Data Exchange (ETDEWEB)

    Karcı, Özgür [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Department of Nanotechnology and Nanomedicine, Hacettepe University, Beytepe, 06800 Ankara (Turkey); Dede, Münir [NanoMagnetics Instruments Ltd., Hacettepe - İvedik OSB Teknokent, 1368. Cad., No: 61/33, 06370, Yenimahalle, Ankara (Turkey); Oral, Ahmet, E-mail: orahmet@metu.edu.tr [Department of Physics, Middle East Technical University, 06800 Ankara (Turkey)

    2014-10-01

    We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be ~12 fm/√Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system.

  10. Scanning ion conductance microscopy with distance-modulated shear force control

    Science.gov (United States)

    Böcker, Matthias; Anczykowski, Boris; Wegener, Joachim; Schäffer, Tilman E.

    2007-04-01

    A scanning ion conductance microscope (SICM) is based on a tapered nanopipette as a nanoscale conductance probe that is scanned over a sample submerged in an electrolyte solution. In conventional SICM scanning the ion current through the pipette aperture is at the nano- and picoampere level and is influenced by both sample topography and local conductance. Here we present an SICM with integrated shear-force distance control that allows measuring the ion current independently of sample topography. The nanopipette is hereby transversally vibrated and the shear forces that arise are detected optically with the help of two periscopes that are partially submerged in the electrolyte. We also present a new imaging mode designed to facilitate shear-force imaging of soft samples. This mode is based on a periodic modulation of the pipette-sample distance combined with triggered sampling, reducing the probability for sample and pipette damage and increasing the image quality. We apply this imaging mode to polycarbonate membranes and mammalian cells.

  11. Fabrication of Josephson junctions by using an atomic force microscope

    CERN Document Server

    Song, I S; Kim, D H; Park, G S

    2000-01-01

    Josephson junctions have been fabricated by using an atomic foce microscope (AFM) for surface modification. YBCO films were fabricated on MgO substrates by using pulsed laser deposition. Surface modification of YBCO strips in the field of conductive AFM tips results in controlled and systematic growth of protrusions across the entire strip. Increasing the negative bias voltage to the AFM tip linearly increases the size of the modified structures. The offset superconducting transition temperature and the critical current values systematically shift to lower temperature and current values with increasing degree of AFM modification.

  12. Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Peng; Behan, Gavin; Kirkland, Angus I. [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Nellist, Peter D., E-mail: peter.nellist@materials.ox.ac.uk [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom); Cosgriff, Eireann C.; D' Alfonso, Adrian J.; Morgan, Andrew J.; Allen, Leslie J. [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Hashimoto, Ayako [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Takeguchi, Masaki [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Mitsuishi, Kazutaka [Advanced Nano-characterization Center, National Institute for Materials Science (NIMS), 3-13 Sakura, Tsukuba 305-0003 (Japan); Quantum Dot Research Center, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Shimojo, Masayuki [High Voltage Electron Microscopy Station, NIMS, 3-13 Sakura, Tsukuba 305-0003 (Japan); Advanced Science Research Laboratory, Saitama Institute of Technology, 1690 Fusaiji, Fukaya 369-0293 (Japan)

    2011-06-15

    Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM is the bright-field mode. In this paper we present experimental data and simulations showing the form of bright-field SCEM images. We show that the depth dependence of the three-dimensional image can be explained in terms of two-dimensional images formed in the detector plane. For a crystalline sample, this so-called probe image is shown to be similar to a conventional diffraction pattern. Experimental results and simulations show how the diffracted probes in this image are elongated in thicker crystals and the use of this elongation to estimate sample thickness is explored. -- Research Highlights: {yields} The confocal probe image in a scanning confocal electron microscopy image reveals information about the thickness and height of the crystalline layer. {yields} The form of the contrast in a three-dimensional bright-field scanning confocal electron microscopy image can be explained in terms of the confocal probe image. {yields} Despite the complicated form of the contrast in bright-field scanning confocal electron microscopy, we see that depth information is transferred on a 10 nm scale.

  13. Imaging inflammation in mouse colon using a rapid stage-scanning confocal fluorescence microscope.

    Science.gov (United States)

    Saldua, Meagan A; Olsovsky, Cory A; Callaway, Evelyn S; Chapkin, Robert S; Maitland, Kristen C

    2012-01-01

    Large area confocal microscopy may provide fast, high-resolution image acquisition for evaluation of tissue in pre-clinical studies with reduced tissue processing in comparison to histology. We present a rapid beam and stage-scanning confocal fluorescence microscope to image cellular and tissue features along the length of the entire excised mouse colon. The beam is scanned at 8,333 lines/sec by a polygon scanning mirror while the specimen is scanned in the orthogonal axis by a motorized translation stage with a maximum speed of 7 mm/sec. A single 1 × 60 mm(2) field of view image spanning the length of the mouse colon is acquired in 10 s. Z-projection images generated from axial image stacks allow high resolution imaging of the surface of non-flat specimens. In contrast to the uniform size, shape, and distribution of colon crypts in confocal images of normal colon, confocal images of chronic bowel inflammation exhibit heterogeneous tissue structure with localized severe crypt distortion.

  14. Study of skin of an Egyptian mummy using a scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Mańkowska-Pliszka Hanna

    2017-06-01

    Full Text Available The first study of modified human remains using an electron microscope was carried out at the end of the 1950 and in 1979 the first result of the study involving a scanning electron microscope (SEM was published for the first time. The study was mainly focused on the structure of tissues and cells. With the help of this technique cell and tissue elements, viruses and bacterial endospores as well as the structure of epithelium and the collagen contents of dermis were identified and described. In the above-mentioned case the object of the study using a SEM was a free part of the right hand (forearm with the dorsal and palmar parts of hand of unknown origin, with signs of mummification revealed during microscopic analysis. Our study was aimed at finding the answer to the question if the mummification of the studied limb was natural or intentional, and if the study using a SEM could link the anonymous remains with ancient Egypt.

  15. Polarized light and scanning electron microscopic investigation of enamel hypoplasia in primary teeth.

    Science.gov (United States)

    Sabel, Nina; Klingberg, Gunilla; Dietz, Wolfram; Nietzsche, Sandor; Norén, Jörgen G

    2010-01-01

    Enamel hypoplasia is a developmental disturbance during enamel formation, defined as a macroscopic defect in the enamel, with a reduction of the enamel thickness with rounded, smooth borders. Information on the microstructural level is still limited, therefore further studies are of importance to better understand the mechanisms behind enamel hypoplasia. To study enamel hypoplasia in primary teeth by means of polarized light microscopy and scanning electron microscopy. Nineteen primary teeth with enamel hypoplasia were examined in a polarized light microscope and in a scanning electron microscope. The cervical and incisal borders of the enamel hypoplasia had a rounded appearance, as the prisms in the rounded cervical area of the hypoplasia were bent. The rounded borders had a normal surface structure whereas the base of the defects appeared rough and porous. Morphological findings in this study indicate that the aetiological factor has a short duration and affects only certain ameloblasts. The bottom of the enamel hypoplasia is porous and constitutes possible pathways for bacteria into the dentin.

  16. [Observation and analysis of microstructure of dentin caries lesions through 3D laser scanning microscope].

    Science.gov (United States)

    Lixia, Xu; Hongmei, Xu; Xiaoying, Zhu; Limei, Sun

    2016-10-01

    Microstructural changes in dentin carious lesions were investigated using a 3D laser scanning microscope, which has a morphological theoretical foundation in the further study of clinical caries disease prevention and treatments. Six fresh extracted caries molars were prepared into cross-section specimens. The sections were examined by 3D and laser measuring morphology. Zones were identified in the lesions on the basis of their optical appearance. Two zones were identified in the lesions on the basis of their laser appearance. The microstructure showed that the tubular was partly closed in transparent dentin; peritubular and intertubular dentin were reduced in the zone of demineralization; peritubular and intertubular dentin were damaged and fused; a beaded sample and oval lesions formed in the zone of bacterial invasion; and abnormal dentin structure was present in the zone of destruction on the basis of their laser appearance. Four zones were iden-tified in the lesions according to their colors, as determined from their 3D appearance. 3D laser scanning micros-cope may be a powerful, accessible, and non-destructive technique, as it identified the lesion and tubular zones, as well as peritubular and intertubular dentin in the four zones' lesions. The microstructure of dentin caries lesions may have significant merit in the evaluation of clinical prevention and treatment.

  17. Development of apertureless near-field scanning optical microscope tips for tip-enhanced Raman spectroscopy.

    Science.gov (United States)

    Kodama, T; Umezawa, T; Watanabe, S; Ohtani, H

    2008-02-01

    In this study, we suggested two types of novel metallized tip for the apertureless near-field scanning optical microscope probe. The first is a silver nanorod immobilized tip and the other is a double metallized probe. We calculated the electric field enhancement factor and the electric field distribution of a single sphere, aggregated spheres, an ellipse and a nanorod by the finite-differential time-domain method to improve the silver nanosphere immobilized tip developed in our previous studies. The enhanced field of the nanorod is localized at the external surfaces. The simulation results of the nanorod revealed that the position of the maximum peak is shifted to a longer wavelength and that its electric field enhancement factor increases as the aspect ratio increases. Thus, we developed the silver nanorod immobilized tip, and the tip-enhanced Raman spectrum of rhodamine 6G molecule on the substrate could be measured by the tip though it could not be detected by the previous nanosphere immobilized tip. Further, the finite-differential time-domain calculation predicted that the double metallized tips considerably enhance the electric field and that its enhancement factor in the longer wavelength region (500-600 nm) does not decrease when the tip is rounded. The results show that the proposed metallized tips were useful for the apertureless near-field scanning optical microscope system.

  18. Fibrous architecture of cementodentinal junction in disease: A scanning electron microscopic study.

    Science.gov (United States)

    Sudhakar, R; Pratebha, B

    2015-01-01

    The cementodentinal junction (CDJ) forms a biological and structural link between cementum and dentin. This biological link is regarded as a distinct tissue in its own right. Certain important proteins responsible for periodontal regeneration are said to be present in this tissue. Few studies have described the structure and composition of this layer by light and electron microscopy. Scanning electron microscopic studies pertaining to CDJ in health and disease are few and documentation of periodontal pathological changes of CDJ is unclear. In the first phase of our study, the collagenous architecture of CDJ of healthy teeth has been reported. The objective of this study is to observe and report periodontal pathological changes in the fibrous or collagenous architecture of CDJ of periodontitis-affected teeth and discuss the probable clinical implications of CDJ in disease. Twenty periodontitis-affected teeth were collected and processed for observing under a scanning electron microscope. The results are as follows: Increased width of interface at CDJ in periodontitis samples (7.1 μ) compared to that of healthy samples; fewer areas of fiber intermingling at CDJ in periodontitis samples as compared to healthy samples; frequent detachment of cementum from dentin during sodium hydroxide maceration of samples. It may be inferred from results that there is a possibility of a definite weakening of CDJ in periodontally affected root surfaces and we believe that clinical procedures such as scaling and root planning may have a detrimental effect on the cementodentinal attachment of periodontally involved root surfaces.

  19. Excitation-scanning hyperspectral imaging system for microscopic and endoscopic applications

    Science.gov (United States)

    Mayes, Sam A.; Leavesley, Silas J.; Rich, Thomas C.

    2016-04-01

    Current microscopic and endoscopic technologies for cancer screening utilize white-light illumination sources. Hyper-spectral imaging has been shown to improve sensitivity while retaining specificity when compared to white-light imaging in both microscopy and in vivo imaging. However, hyperspectral imaging methods have historically suffered from slow acquisition times due to the narrow bandwidth of spectral filters. Often minutes are required to gather a full image stack. We have developed a novel approach called excitation-scanning hyperspectral imaging that provides 2-3 orders of magnitude increased signal strength. This reduces acquisition times significantly, allowing for live video acquisition. Here, we describe a preliminary prototype excitation-scanning hyperspectral imaging system that can be coupled with endoscopes or microscopes for hyperspectral imaging of tissues and cells. Our system is comprised of three subsystems: illumination, transmission, and imaging. The illumination subsystem employs light-emitting diode arrays to illuminate at different wavelengths. The transmission subsystem utilizes a unique geometry of optics and a liquid light guide. Software controls allow us to interface with and control the subsystems and components. Digital and analog signals are used to coordinate wavelength intensity, cycling and camera triggering. Testing of the system shows it can cycle 16 wavelengths at as fast as 1 ms per cycle. Additionally, more than 18% of the light transmits through the system. Our setup should allow for hyperspectral imaging of tissue and cells in real time.

  20. QUANTIFICATION OF BIOFILMS IN MULTI-SPECTRAL DIGITAL1 VOLUMES FROM CONFOCAL LASER-SCANNING MICROSCOPES

    Directory of Open Access Journals (Sweden)

    Karsten Rodenacker

    2011-05-01

    Full Text Available Populations of bacteria in sludge flocs and biofilm marked by fluorescence marked with fluorescent probes are digitised with a confocal laser scanning microscope. These data are used to analyse the microbial community structure, to obtain information on the localisation of specific bacterial groups and to examine gene expression. This information is urgently required for an in-depth understanding of the function and, more generally, the microbial ecology of biofilms. Methods derived from quantitative image analysis are applied to digitised data from confocal laser scanning microscopes to obtain quantitative descriptions of volumetric, topological (and topographical properties of different compartments of the components under research. In addition to free-moving flocs, also biofilms attached to a substratum in an experimental environment are analysed. Growth form as well as interaction of components are quantitatively described. Classical measurements of volume and intensity (shape, distribution and distance dependent interaction measurements using methods from mathematical morphology are performed. Mainly image (volume processing methods are outlined. Segmented volumes are globally and individually (in terms of 3Dconnected components measured and used for distance mapping transform as well as for estimation of geodesic distances from the substrate. All transformations are applied on the 3D data set. Resulting distance distributions are quantified and related to information on the identity and activity of the probe-identified bacteria.

  1. Evaluation of carbon nanotube probes in critical dimension atomic force microscopes

    Science.gov (United States)

    Choi, Jinho; Park, Byong Chon; Ahn, Sang Jung; Kim, Dal-Hyun; Lyou, Joon; Dixson, Ronald G.; Orji, Ndubuisi G.; Fu, Joseph; Vorburger, Theodore V.

    2016-07-01

    The decreasing size of semiconductor features and the increasing structural complexity of advanced devices have placed continuously greater demands on manufacturing metrology, arising both from the measurement challenges of smaller feature sizes and the growing requirement to characterize structures in more than just a single critical dimension. For scanning electron microscopy, this has resulted in increasing sophistication of imaging models. For critical dimension atomic force microscopes (CD-AFMs), this has resulted in the need for smaller and more complex tips. Carbon nanotube (CNT) tips have thus been the focus of much interest and effort by a number of researchers. However, there have been significant issues surrounding both the manufacture and use of CNT tips. Specifically, the growth or attachment of CNTs to AFM cantilevers has been a challenge to the fabrication of CNT tips, and the flexibility and resultant bending artifacts have presented challenges to using CNT tips. The Korea Research Institute for Standards and Science (KRISS) has invested considerable effort in the controlled fabrication of CNT tips and is collaborating with the National Institute of Standards and Technology on the application of CNT tips for CD-AFM. Progress by KRISS on the precise control of CNT orientation, length, and end modification, using manipulation and focused ion beam processes, has allowed us to implement ball-capped CNT tips and bent CNT tips for CD-AFM. Using two different generations of CD-AFM instruments, we have evaluated these tip types by imaging a line/space grating and a programmed line edge roughness specimen. We concluded that these CNTs are capable of scanning the profiles of these structures, including re-entrant sidewalls, but there remain important challenges to address. These challenges include tighter control of tip geometry and careful optimization of scan parameters and algorithms for using CNT tips.

  2. A design for a subminiature, low energy scanning electron microscope with atomic resolution

    Science.gov (United States)

    Eastham, D. A.; Edmondson, P.; Greene, S.; Donnelly, S.; Olsson, E.; Svensson, K.; Bleloch, A.

    2009-01-01

    We describe a type of scanning electron microscope that works by directly imaging the electron field-emission sites on a nanotip. Electrons are extracted from the nanotip through a nanoscale aperture, accelerated in a high electric field, and focused to a spot using a microscale Einzel lens. If the whole microscope (accelerating section and lens) and the focal length are both restricted in size to below 10 μm, then computer simulations show that the effects of aberration are extremely small and it is possible to have a system with approximately unit magnification at electron energies as low as 300 eV. Thus a typical emission site of 1 nm diameter will produce an image of the same size, and an atomic emission site will give a resolution of 0.1-0.2 nm (1-2 Å). Also, because the beam is not allowed to expand beyond 100 nm in diameter, the depth of field is large and the contribution to the beam spot size from chromatic aberrations is less than 0.02 nm (0.2 Å) for 500 eV electrons. Since it is now entirely possible to make stable atomic sized emitters (nanopyramids), it is expected that this instrument will have atomic resolution. Furthermore the brightness of the beam is determined only by the field emission and can be up to 1×106 times larger than in a typical (high energy) electron microscope. The advantages of this low energy, bright-beam electron microscope with atomic resolution are described and include the possibility of it being used to rapidly sequence the human genome from a single strand of DNA as well as being able to identify atomic species directly from the elastic scattering of electrons.

  3. High-resolution photon-scanning tunneling microscope measurements of the whispering gallery modes in a cylindrical microresonator

    NARCIS (Netherlands)

    Klunder, D.J.W.; Balistreri, M.L.M.; Blom, F.C.; Driessen, A.; Hoekstra, Hugo; Kuipers, L.; van Hulst, N.F.

    2000-01-01

    A detailed analysis of spatio-spectral photon scanning tunneling microscope scans of the light intensity inside a cylindrical microresonator has been carried out. By comparing the experimental results with theory, it is shown that the inclusion of spectral mode-beat phenomena is crucial for an

  4. Optical microscope combined with the nanopipette-based quartz tuning fork-atomic force microscope for nanolithography

    Science.gov (United States)

    An, Sangmin; Stambaugh, Corey; Kwon, Soyoung; Lee, Kunyoung; Kim, Bongsu; Kim, Qwhan; Jhe, Wonho

    2013-09-01

    We demonstrated the optical microscope (OM) combined with nanopipette-based quartz tuning fork - atomic force microscope (QTF-AFM) for nanolithography. The nanoparticle (Au, 5 nm), nanowire, PDMS solutions are ejected onto the substrate through the nano/microaperture of the pulled pipette, and the nano/microscale objects were in-situ formed on the surface with the proposed patterning system, while the position is defined by monitoring the phenomena on the substrate with a home-made OM. After forming of capillary condensation between apex of the pipette tip and the surface, the electric field is applied to extract out the inside liquid to the substrate and the nano/microscale objects are fabricated. The nanoscale patterning size can be controlled by the aperture diameters of the pulled pipette.

  5. Novel low-dose imaging technique for characterizing atomic structures through scanning transmission electron microscope

    Science.gov (United States)

    Su, Chia-Ping; Syu, Wei-Jhe; Hsiao, Chien-Nan; Lai, Ping-Shan; Chen, Chien-Chun

    2017-08-01

    To investigate dislocations or heterostructures across interfaces is now of great interest to condensed matter and materials scientists. With the advances in aberration-corrected electron optics, the scanning transmission electron microscope has demonstrated its excellent capability of characterizing atomic structures within nanomaterials, and well-resolved atomic-resolution images can be obtained through long-exposure data acquisition. However, the sample drifting, carbon contamination, and radiation damage hinder further analysis, such as deriving three-dimensional (3D) structures from a series of images. In this study, a method for obtaining atomic-resolution images with significantly reduced exposure time was developed, using which an original high-resolution image with approximately one tenth the electron dose can be obtained by combining a fast-scan high-magnification image and a slow-scan low-magnification image. The feasibility of obtaining 3D atomic structures using the proposed approach was demonstrated through multislice simulation. Finally, the feasibility and accuracy of image restoration were experimentally verified. This general method cannot only apply to electron microscopy but also benefit to image radiation-sensitive materials using various light sources.

  6. Humidity effects on scanning polarization force microscopy imaging

    Energy Technology Data Exchange (ETDEWEB)

    Shen, Yue, E-mail: shenyue@isl.ac.cn [Key Laboratory of Comprehensive and Highly Efficient Utilization of Salt Lake Resources, Key Laboratory of Salt Lake Resources Chemistry of Qinghai Province, Qinghai Institute of Salt Lakes, Chinese Academy of Sciences, Xining, Qinghai 810008 (China); Key Laboratory of Interfacial Physics and Technology of Chinese Academy of Sciences, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800 (China); Zhou, Yuan, E-mail: zhouy@isl.ac.cn [Key Laboratory of Comprehensive and Highly Efficient Utilization of Salt Lake Resources, Key Laboratory of Salt Lake Resources Chemistry of Qinghai Province, Qinghai Institute of Salt Lakes, Chinese Academy of Sciences, Xining, Qinghai 810008 (China); Sun, Yanxia; Zhang, Lijuan [Key Laboratory of Comprehensive and Highly Efficient Utilization of Salt Lake Resources, Key Laboratory of Salt Lake Resources Chemistry of Qinghai Province, Qinghai Institute of Salt Lakes, Chinese Academy of Sciences, Xining, Qinghai 810008 (China); University of Chinese Academy of Sciences, Beijing 100049 (China); Wang, Ying; Hu, Jun; Zhang, Yi [Key Laboratory of Interfacial Physics and Technology of Chinese Academy of Sciences, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800 (China)

    2017-08-01

    Highlights: • The humidity dramatically affects the contrast of scanning polarization force microscopy (SPFM) imaging on mica surface. • This influence roots in the sensitive dielectric constant of mica surface to the humidity change. • A strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM is proposed. - Abstract: Scanning polarization force microscopy (SPFM) is a useful surface characterization technique to visually characterize and distinguish nanomaterial with different local dielectric properties at nanometer scale. In this paper, taking the individual one-atom-thick graphene oxide (GO) and reduced graphene oxide (rGO) sheets on mica as examples, we described the influences of environmental humidity on SPFM imaging. We found that the apparent heights (AHs) or contrast of SPFM imaging was influenced significantly by relative humidity (RH) at a response time of a few seconds. And this influence rooted in the sensitive dielectric constant of mica surface to the RH change. While dielectric properties of GO and rGO sheets were almost immune to the humidity change. In addition, we gave the method to determine the critical humidity at which the contrast conversion happened under different conditions. And this is important to the contrast control and repeatable imaging of SPFM through RH adjusting. These findings suggest a strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM, which is critically important for further distinguishment, manipulation, electronic applications, etc.

  7. Measuring the interaction forces between protein inclusion bodies and an air bubble using an atomic force microscope.

    Science.gov (United States)

    Wangsa-Wirawan, N D; Ikai, A; O'Neill, B K; Middelberg, A P

    2001-01-01

    Interaction forces between protein inclusion bodies and an air bubble have been quantified using an atomic force microscope (AFM). The inclusion bodies were attached to the AFM tip by covalent bonds. Interaction forces measured in various buffer concentrations varied from 9.7 nN to 25.3 nN (+/- 4-11%) depending on pH. Hydrophobic forces provide a stronger contribution to overall interaction force than electrostatic double layer forces. It also appears that the ionic strength affects the interaction force in a complex way that cannot be directly predicted by DLVO theory. The effects of pH are significantly stronger for the inclusion body compared to the air bubble. This study provides fundamental information that will subsequently facilitate the rational design of flotation recovery system for inclusion bodies. It has also demonstrated the potential of AFM to facilitate the design of such processes from a practical viewpoint.

  8. Placing single atoms in graphene with a scanning transmission electron microscope

    Science.gov (United States)

    Dyck, Ondrej; Kim, Songkil; Kalinin, Sergei V.; Jesse, Stephen

    2017-09-01

    We employ the sub-atomically focused beam of a scanning transmission electron microscope (STEM) to introduce and controllably manipulate individual dopant atoms in a 2D graphene lattice. The electron beam is used to create defects and subsequently sputter adsorbed source materials into the graphene lattice such that individual vacancy defects are controllably passivated by Si substitutional atoms. We further document that Si point defects may be directed through the lattice via e-beam control or modified (as yet, uncontrollably) to form new defects which can incorporate new atoms into the graphene lattice. These studies demonstrate the potential of STEM for atom-by-atom nanofabrication and fundamental studies of chemical reactions in 2D materials on the atomic level.

  9. Scanning Electron Microscopic Studies of the Pecten Oculi in the Quail (Coturnix coturnix japonica

    Directory of Open Access Journals (Sweden)

    Aris F. Pourlis

    2013-01-01

    Full Text Available The main purpose of this study is to extend the microscopic investigations of the pecten oculi in the quail in order to add some information on the unresolved functional anatomy of this unique avian organ. The pecten oculi of the quail was studied by scanning electron microscopy. Eighteen- to-twenty two highly vascularised accordion-like folds were joined apically by a heavily pigmented bridge of tissue, which holds the pecten in a fanlike shape, widest at the base. The structure of the double layered limiting membrane was recorded. The presence of hyalocytes with macrophage-like appearance was illustrated. It is assumed that the pecten oculi of the quail resembles that of the chicken. Illustrated morphological features of this species may add information on the active physiological role of the pecten. But still, the functional significance of this organ is a matter of controversies.

  10. Standard practice for calibrating the magnification of a scanning electron microscope

    CERN Document Server

    American Society for Testing and Materials. Philadelphia

    2008-01-01

    1.1 This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions. Therefore, this practice must be applied to each set of standard operating conditions to be used. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

  11. In situ scanning tunneling microscope tip treatment device for spin polarization imaging

    Science.gov (United States)

    Li, An-Ping [Oak Ridge, TN; Jianxing, Ma [Oak Ridge, TN; Shen, Jian [Knoxville, TN

    2008-04-22

    A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM to a spin-polarized tip, and thereby converts a standard STM system into a spin-polarized STM system. The tip treatment device also has functions of tip cleaning and tip flashing a STM tip to high temperature (>2000.degree. C.) in an extremely localized fashion. Tip coating functions can also be carried out, providing the tip sharp end with monolayers of coating materials including magnetic films. The device is also fully compatible with ultrahigh vacuum sample transfer setups.

  12. In situ study of live specimens in an environmental scanning electron microscope.

    Science.gov (United States)

    Tihlaříková, Eva; Neděla, Vilém; Shiojiri, Makoto

    2013-08-01

    In this paper we introduce new methodology for the observation of living biological samples in an environmental scanning electron microscope (ESEM). The methodology is based on an unconventional initiation procedure for ESEM chamber pumping, free from purge-flood cycles, and on the ability to control thermodynamic processes close to the sample. The gradual and gentle change of the working environment from air to water vapor enables the study of not only living samples in dynamic in situ experiments and their manifestation of life (sample walking) but also its experimentally stimulated physiological reactions. Moreover, Monte Carlo simulations of primary electron beam energy losses in a water layer on the sample surface were studied; consequently, the influence of the water thickness on radiation, temperature, or chemical damage of the sample was considered.

  13. Scanning electron microscopic observations of fibrous structure of cemento-dentinal junction in healthy teeth.

    Science.gov (United States)

    Pratebha, B; Jaikumar, N D; Sudhakar, R

    2014-01-01

    The cemento-dentinal junction (CDJ) is a structural and biologic link between cementum and dentin present in the roots of teeth. Conflicting reports about the origin, structure and composition of this layer are present in literature. The width of this junctional tissue is reported to be about 2-4 μm with adhesion of cementum and dentin by proteoglycans and by collagen fiber intermingling. The objective of this study is to observe and report the fibrous architecture of the CDJ of healthy tooth roots. A total of 15 healthy teeth samples were collected, sectioned into halves, demineralized in 5% ethylenediaminetetraacetic acid, processed using NaOH maceration technique and observed under a scanning electron microscope. The CDJ appeared to be a fibril poor groove with a width of 2-4 µm. Few areas of collagen fiber intermingling could be appreciated. A detailed observation of these tissues has been presented.

  14. The migration of lymphocytes across the vascular endothelium in lymph nodes: a scanning electron microscopic study.

    Science.gov (United States)

    Nishi, M; Hamada, N; Nomura, H; Mastueda, M; Aiko, T

    1979-03-01

    Endothelial cells of Postcapillary Venules (PCV) and the passage of lymphocytes through the wall of PCV were investigated with Scanning Electron Microscope (SEM) in mesenteric lymph nodes of rats. Individual endothelial cells of PCV in the lymph node did not have flat surface or were not typically cubic, but swelled at the central part assuming a foot ball-like shape. Circulating lymphocytes are considered to migrate into lymphatic tissues through the wall of PCV from the blood stream. Two hypotheses, inter-endothelial cell passage and intra-endothelial cell passage, have been proposed. The three-dimensional studies on lymphocytes passing the wall with SEM confirmed that migrating lymphocytes pushes their way through the intercellular space with pressing the adjoining endothelial cells from beginning to end, supporting the former hypothesis. Invasion of lymphocytes into endothelial cells were not observed.

  15. Determination of the sequence of intersecting lines using Focused Ion Beam/Scanning Electron Microscope.

    Science.gov (United States)

    Kim, Jiye; Kim, MinJung; An, JinWook; Kim, Yunje

    2016-05-01

    The aim of this study was to verify that the combination of focused ion beam (FIB) and scanning electron microscope/energy-dispersive X-ray (SEM/EDX) could be applied to determine the sequence of line crossings. The samples were transferred into FIB/SEM for FIB milling and an imaging operation. EDX was able to explore the chemical components and the corresponding elemental distribution in the intersection. The technique was successful in determining the sequence of heterogeneous line intersections produced using gel pens and red sealing ink with highest success rate (100% correctness). These observations show that the FIB/SEM was the appropriate instrument for an overall examination of document. © 2016 American Academy of Forensic Sciences.

  16. Sensitivity Analysis of X-ray Spectra from Scanning Electron Microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Miller, Thomas Martin [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Patton, Bruce W. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Weber, Charles F. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Bekar, Kursat B. [Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

    2014-10-01

    The primary goal of this project is to evaluate x-ray spectra generated within a scanning electron microscope (SEM) to determine elemental composition of small samples. This will be accomplished by performing Monte Carlo simulations of the electron and photon interactions in the sample and in the x-ray detector. The elemental inventories will be determined by an inverse process that progressively reduces the difference between the measured and simulated x-ray spectra by iteratively adjusting composition and geometric variables in the computational model. The intended benefit of this work will be to develop a method to perform quantitative analysis on substandard samples (heterogeneous phases, rough surfaces, small sizes, etc.) without involving standard elemental samples or empirical matrix corrections (i.e., true standardless quantitative analysis).

  17. Advances in imaging and electron physics the scanning transmission electron microscope

    CERN Document Server

    Hawkes, Peter W

    2009-01-01

    Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians.

  18. Design of a cathodoluminescence image generator using a Raspberry Pi coupled to a scanning electron microscope.

    Science.gov (United States)

    Benítez, Alfredo; Santiago, Ulises; Sanchez, John E; Ponce, Arturo

    2018-01-01

    In this work, an innovative cathodoluminescence (CL) system is coupled to a scanning electron microscope and synchronized with a Raspberry Pi computer integrated with an innovative processing signal. The post-processing signal is based on a Python algorithm that correlates the CL and secondary electron (SE) images with a precise dwell time correction. For CL imaging, the emission signal is collected through an optical fiber and transduced to an electrical signal via a photomultiplier tube (PMT). CL Images are registered in a panchromatic mode and can be filtered using a monochromator connected between the optical fiber and the PMT to produce monochromatic CL images. The designed system has been employed to study ZnO samples prepared by electrical arc discharge and microwave methods. CL images are compared with SE images and chemical elemental mapping images to correlate the emission regions of the sample.

  19. Design of a cathodoluminescence image generator using a Raspberry Pi coupled to a scanning electron microscope

    Science.gov (United States)

    Benítez, Alfredo; Santiago, Ulises; Sanchez, John E.; Ponce, Arturo

    2018-01-01

    In this work, an innovative cathodoluminescence (CL) system is coupled to a scanning electron microscope and synchronized with a Raspberry Pi computer integrated with an innovative processing signal. The post-processing signal is based on a Python algorithm that correlates the CL and secondary electron (SE) images with a precise dwell time correction. For CL imaging, the emission signal is collected through an optical fiber and transduced to an electrical signal via a photomultiplier tube (PMT). CL Images are registered in a panchromatic mode and can be filtered using a monochromator connected between the optical fiber and the PMT to produce monochromatic CL images. The designed system has been employed to study ZnO samples prepared by electrical arc discharge and microwave methods. CL images are compared with SE images and chemical elemental mapping images to correlate the emission regions of the sample.

  20. A novel and compact nanoindentation device for in situ nanoindentation tests inside the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    Hu Huang

    2012-03-01

    Full Text Available In situ nanomechanical tests provide a unique insight into mechanical behaviors of materials, such as fracture onset and crack propagation, shear band formation and so on. This paper presents a novel in situ nanoindentation device with dimensions of 103mm×74mm×60mm. Integrating the stepper motor, the piezoelectric actuator and the flexure hinge, the device can realize coarse adjustment of the specimen and precision loading and unloading of the indenter automatically. A novel indenter holder was designed to guarantee that the indenter penetrates into and withdraws from the specimen surface vertically. Closed-loop control of the indentation process was established to solve the problem of nonlinearity of the piezoelectric actuator and to enrich the loading modes. The in situ indentation test of Indium Phosphide (InP inside the scanning electron microscope (SEM was carried out and the experimental result indicates the feasibility of the developed device.

  1. Local electroporation of a single cell using a scanning ion conductance microscope

    Science.gov (United States)

    Iwata, Futoshi; Yamazaki, Koji; Ishizaki, Kimihiro; Ushiki, Tatuo

    2014-03-01

    We developed a novel electroporation technique for molecular delivery into a single cell. A nanopipette, a thermally pulled glass capillary, is prepared as to act as a pair of tiny electrodes for single-cell electroporation. An Ag/AgCl wire is inserted into the nanopipette, and the outside edge of the nanopipette is coated by Ag sputtering. Electric pulses are applied between the outside and inside electrodes to form a local electric field at the edge of the nanopipette. To position the pipette edge in the vicinity of the cell membrane, we control the probe-surface distance using a scanning ion conductance microscope (SICM). The SICM technique achieves non-contact approach of the nanopipette edge on the cell membrane, which allows low-invasive electroporation of a single cell. As a demonstration of this technique, a fluorescent molecule of propidium iodide was successfully delivered into a single HeLa cell.

  2. Apertureless scanning microscope probe as a detector of semiconductor laser emission

    Energy Technology Data Exchange (ETDEWEB)

    Dunaevskiy, Mikhail, E-mail: Mike.Dunaeffsky@mail.ioffe.ru [Ioffe Institute, Saint-Petersburg 194021 (Russian Federation); National Research University of Information Technologies, Mechanics and Optics (ITMO), Saint-Petersburg 197101 (Russian Federation); Dontsov, Anton; Monakhov, Andrei [Ioffe Institute, Saint-Petersburg 194021 (Russian Federation); Alekseev, Prokhor; Titkov, Alexander [Ioffe Institute, Saint-Petersburg 194021 (Russian Federation); Saint Petersburg Electrotechnical University ' LETI,' Saint-Petersburg 197376 (Russian Federation); Baranov, Alexei; Girard, Paul; Arinero, Richard; Teissier, Roland [Institut d' Electronique du Sud, UMR 5214 UM2-CNRS, CC082, Université Montpellier 2, 34095 Montpellier Cedex 5 (France)

    2015-04-27

    An operating semiconductor laser has been studied using a scanning probe microscope. A shift of the resonance frequency of probe that is due to its heating by laser radiation has been analyzed. The observed shift is proportional to the absorbed radiation and can be used to measure the laser near field or its output power. A periodical dependence of the measured signal has been observed as a function of distance between the probe and the surface of the laser due to the interference of the outgoing and cantilever-reflected waves. Due to the multiple reflections resulting in the interference, the light absorption by the probe cantilever is greatly enhanced compared with a single pass case. Interaction of infrared emission of a diode laser with different probes has been studied.

  3. Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Johnston-Peck, Aaron C., E-mail: aaron.johnston-peck@nist.gov [Materials Measurement Lab, National Institute of Standards Technology, Gaithersburg, MD 20899 (United States); DuChene, Joseph S.; Roberts, Alan D.; Wei, Wei David [Department of Chemistry and Center for Nanostructured Electronic Materials, University of Florida, Gainesville, FL 32611 (United States); Herzing, Andrew A. [Materials Measurement Lab, National Institute of Standards Technology, Gaithersburg, MD 20899 (United States)

    2016-11-15

    Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO{sub 2} indicate that there is not a critical dose required for the accumulation of electron beam damage. Instead, measurements using annular dark field scanning transmission electron microscopy and electron energy loss spectroscopy demonstrate that the onset of measurable damage occurs when a critical dose rate is exceeded. The mechanism behind this phenomenon is that oxygen vacancies created by exposure to a 300 keV electron beam are actively annihilated as the sample re-oxidizes in the microscope environment. As a result, only when the rate of vacancy creation exceeds the recovery rate will beam damage begin to accumulate. This observation suggests that dose-intensive experiments can be accomplished without disrupting the native structure of the sample when executed using dose rates below the appropriate threshold. Furthermore, the presence of an encapsulating carbonaceous layer inhibits processes that cause beam damage, markedly increasing the dose rate threshold for the accumulation of damage. - Highlights: • Electron beam interactions introduce oxygen vacancies in CeO{sub 2} nanoparticles. • ADF-STEM and EELS can track the reduction of CeO{sub 2}. • The reduced nanoparticles will oxidize in the microscope environment. • There is no critical dose for the accumulation of detectable damage. • The accumulation of detectable damage is dose rate dependent.

  4. Experimental evaluation of environmental scanning electron microscopes at high chamber pressure.

    Science.gov (United States)

    Fitzek, H; Schroettner, H; Wagner, J; Hofer, F; Rattenberger, J

    2015-11-01

    In environmental scanning electron microscopy (ESEM) high pressure applications have become increasingly important. Wet or biological samples can be investigated without time-consuming sample preparation and potential artefacts from this preparation can be neglected. Unfortunately, the signal-to-noise ratio strongly decreases with increasing chamber pressure. To evaluate the high pressure performance of ESEM and to compare different electron microscopes, information about spatial resolution and detector type is not enough. On the one hand, the scattering of the primary electron beam increases, which vanishes the contrast in images; and on the other hand, the secondary electrons (SE) signal amplification decreases. The stagnation gas thickness (effective distance the beam has to travel through the imaging gas) as well as the SE detection system depend on the microscope and for a complete and serious evaluation of an ESEM or low vacuum SEM it is necessary to specify these two parameters. A method is presented to determine the fraction of scattered and unscattered electrons and to calculate the stagnation gas thickness (θ). To evaluate the high pressure performance of the SE detection system, a method is presented that allows for an analysis of a single image and the calculation of the signal-to-noise ratio of this image. All investigations are performed on an FEI ESEM Quanta 600 (field emission gun) and an FEI ESEM Quanta 200 (thermionic gun). These methods and measurements should represent opportunities for evaluating the high pressure performance of an ESEM. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

  5. Atmospheric scanning electron microscope system with an open sample chamber: Configuration and applications

    Energy Technology Data Exchange (ETDEWEB)

    Nishiyama, Hidetoshi, E-mail: hinishiy@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Koizumi, Mitsuru, E-mail: koizumi@jeol.co.jp [JEOL Technics Ltd., 2-6-38 Musashino, Akishima, Tokyo 196-0021 (Japan); Ogawa, Koji, E-mail: kogawa@jeol.co.jp [JEOL Technics Ltd., 2-6-38 Musashino, Akishima, Tokyo 196-0021 (Japan); Kitamura, Shinich, E-mail: kitamura@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Konyuba, Yuji, E-mail: ykonyuub@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Watanabe, Yoshiyuki, E-mail: watanabeyoshiy@pref.yamagata.jp [Yamagata Research Institute of Technology, 2-2-1, Matsuei, Yamagata 990-2473 (Japan); Ohbayashi, Norihiko, E-mail: n.ohbayashi@m.tohoku.ac.jp [Laboratory of Membrane Trafficking Mechanisms, Department of Developmental Biology and Neurosciences, Graduate School of Life Sciences, Tohoku University, Aobayama, Aoba-ku, Sendai, Miyagi 980-8578 (Japan); Fukuda, Mitsunori, E-mail: nori@m.tohoku.ac.jp [Laboratory of Membrane Trafficking Mechanisms, Department of Developmental Biology and Neurosciences, Graduate School of Life Sciences, Tohoku University, Aobayama, Aoba-ku, Sendai, Miyagi 980-8578 (Japan); Suga, Mitsuo, E-mail: msuga@jeol.co.jp [JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Sato, Chikara, E-mail: ti-sato@aist.go.jp [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-4, Umezono, Tsukuba 305-8568 (Japan)

    2014-12-15

    An atmospheric scanning electron microscope (ASEM) with an open sample chamber and optical microscope (OM) is described and recent developments are reported. In this ClairScope system, the base of the open sample dish is sealed to the top of the inverted SEM column, allowing the liquid-immersed sample to be observed by OM from above and by SEM from below. The optical axes of the two microscopes are aligned, ensuring that the same sample areas are imaged to realize quasi-simultaneous correlative microscopy in solution. For example, the cathodoluminescence of ZnO particles was directly demonstrated. The improved system has (i) a fully motorized sample stage, (ii) a column protection system in the case of accidental window breakage, and (iii) an OM/SEM operation system controlled by a graphical user interface. The open sample chamber allows the external administration of reagents during sample observation. We monitored the influence of added NaCl on the random motion of silica particles in liquid. Further, using fluorescence as a transfection marker, the effect of small interfering RNA-mediated knockdown of endogenous Varp on Tyrp1 trafficking in melanocytes was examined. A temperature-regulated titanium ASEM dish allowed the dynamic observation of colloidal silver nanoparticles as they were heated to 240 °C and sintered. - Highlights: • Atmospheric SEM (ASEM) allows observation of samples in liquid or gas. • Open sample chamber allows in situ monitoring of evaporation and sintering processes. • in situ monitoring of processes during reagent administration is also accomplished. • Protection system for film breakage is developed for ASEM. • Usability of ASEM has been improved significantly including GUI control.

  6. Interferometer-controlled soft X-ray scanning photoemission microscope at SOLEIL

    Science.gov (United States)

    Avila, José; Razado-Colambo, Ivy; Lorcy, Stephane; Giorgetta, Jean-Luc; Polack, François; Asensio, Maria C.

    2013-03-01

    ANTARES beamline (BL), a new soft X-ray scanning photoemission microscope located at the SOLEIL synchrotron storage ring has been recently designed, built and commissioned. The implemented interferometer control allows the accurate measurement of the transverse position of the Fresnel zone plate (FZP) relative to the sample. An effective sample position feedback has been achieved during experiments in static mode, with a fixed FZP position required to perform nano Angle-Resolved Photoelectron Spectroscopy (Nano-ARPES) measurements. Likewise, long-term stability has been attained for the FZP position relative to the sample during the translation of the FZP when performing typical X-ray absorption experiments around the absorption edges of light elements. Moreover, a fully automatic feedback digital control of the interferometric system provides extremely low orthogonal distortion of the recorded two-dimensional images. The microscope is diffraction limited with the resolution set to several tens of nanometers by the quality of the zone plates. Details on the design of the interferometric system and a brief description of the first commissioning results are presented here.

  7. Fabrication of periodic nanostructures using dynamic plowing lithography with the tip of an atomic force microscope

    Science.gov (United States)

    He, Yang; Yan, Yongda; Geng, Yanquan; Brousseau, Emmanuel

    2018-01-01

    The fabrication of periodic nanostructures with a fine control of their dimensions is performed on poly(methyl methacrylate) (PMMA) thin films using an atomic force microscope technique called dynamic plowing lithography (DPL). Different scratching directions are investigated first when generating single grooves with DPL. In particular, the depth, the width and the periodicity of the machined grooves as well the height of the pile-up, formed on the side of the grooves, are assessed. It was found that these features are not significantly affected by the scratching direction, except when processing took place in a direction away from the cantilever probe and parallel to its main axis. For a given scratching direction, arrays of regular grooves are then obtained by controlling the feed, i.e. the distance between two machining lines. A scan-scratch tip trace is also used to reduce processing time and tip wear. However, irregular patterns are created when combining two layers oriented at different angles and where each layer defines an array of grooves. Thus, a ;combination writing; method was implemented to fabricate arrays of grooves with a well-defined wavelength of 30 nm, which was twice the feed value utilized. Checkerboard, diamond-shaped, and hexagonal nanodots were also fabricated. These were obtained by using the combination writing method and by varying the orientation and the number of layers. The density of the nanodots achieved could be as high as 1.9 × 109 nanodots per mm2.

  8. Characterization of the photocurrents generated by the laser of atomic force microscopes

    Energy Technology Data Exchange (ETDEWEB)

    Ji, Yanfeng; Hui, Fei; Shi, Yuanyuan; Lanza, Mario, E-mail: mlanza@suda.edu.cn [Institute of Functional Nano and Soft Materials (FUNSOM), Collaborative Innovation Center of Suzhou Nanoscience and Technology, Soochow University, 199 Ren-Ai Road, Suzhou 215123 (China); Iglesias, Vanessa [International Iberian Nanotechnology Laboratory, 4715-330 Braga (Portugal); Lewis, David [Nanonics Imaging, Har Hotzvim, Jerusalem 91487 (Israel); Niu, Jiebin; Long, Shibing; Liu, Ming [Laboratory of Nanofabrication and Novel Device Integration, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029 (China); Hofer, Alexander; Frammelsberger, Werner; Benstetter, Guenther [Deggendorf Institute of Technology, Edlmairstr. 6+8, 94469 Deggendorf (Germany); Scheuermann, Andrew; McIntyre, Paul C. [Department of Materials Science and Engineering, Stanford University, Stanford, California 94305 (United States)

    2016-08-15

    The conductive atomic force microscope (CAFM) has become an essential tool for the nanoscale electronic characterization of many materials and devices. When studying photoactive samples, the laser used by the CAFM to detect the deflection of the cantilever can generate photocurrents that perturb the current signals collected, leading to unreliable characterization. In metal-coated semiconductor samples, this problem is further aggravated, and large currents above the nanometer range can be observed even without the application of any bias. Here we present the first characterization of the photocurrents introduced by the laser of the CAFM, and we quantify the amount of light arriving to the surface of the sample. The mechanisms for current collection when placing the CAFM tip on metal-coated photoactive samples are also analyzed in-depth. Finally, we successfully avoided the laser-induced perturbations using a two pass technique: the first scan collects the topography (laser ON) and the second collects the current (laser OFF). We also demonstrate that CAFMs without a laser (using a tuning fork for detecting the deflection of the tip) do not have this problem.

  9. Transfected single-cell imaging by scanning electrochemical optical microscopy with shear force feedback regulation.

    Science.gov (United States)

    Takahashi, Yasufumi; Shiku, Hitoshi; Murata, Tatsuya; Yasukawa, Tomoyuki; Matsue, Tomokazu

    2009-12-01

    Gene-transfected single HeLa cells were characterized using a scanning electrochemical/optical microscope (SECM/OM) system with shear-force-based probe-sample distance regulation to simultaneously capture electrochemical, fluorescent, and topographic images. The outer and inner states of single living cells were obtained as electrochemical and fluorescent signals, respectively, by using an optical fiber-nanoelectrode probe. A focused ion beam (FIB) was used to mill the optical aperture and the ring electrode at the probe apex (the inner and outer radii of the ring electrode were 37 and 112 nm, respectively). To apply an appropriate shear force between the probe tip and the living cell surface, we optimized the amplitude of oscillation of the tuning fork to which the probe was attached. Field-programmable gate arrays (FPGA) were adopted to drastically increase the feedback speed of the tip-sample distance regulation, shorten the scanning time for imaging, and enhance the accuracy and quality of the living cell images. In employing these improvements, we simultaneously measured the cellular expression activity of both secreted alkaline phosphatase outside and GFP inside by using the SECM/OM with shear force distance regulation.

  10. Three-dimensional phase-contrast X-ray microtomography with scanning-imaging X-ray microscope optics.

    Science.gov (United States)

    Takeuchi, Akihisa; Uesugi, Kentaro; Suzuki, Yoshio

    2013-09-01

    A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning-imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dimensional (2D) image is recorded independently. An object is illuminated with a line-focused beam. Positional information of the region illuminated by the line-focused beam is recorded with the 1D imaging microscope optics as line-profile data. By scanning the object with the line focus, 2D image data are obtained. In the same manner as for a scanning microscope optics with a multi-pixel detector, imaging modes such as phase contrast and absorption contrast can be arbitrarily configured after the image data acquisition. By combining a tomographic scan method and the SIXM system, quantitative 3D imaging is performed. Results of a feasibility study of the SIXM for 3D imaging are shown.

  11. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization.

    Science.gov (United States)

    Berger, Andrew J; Page, Michael R; Jacob, Jan; Young, Justin R; Lewis, Jim; Wenzel, Lothar; Bhallamudi, Vidya P; Johnston-Halperin, Ezekiel; Pelekhov, Denis V; Hammel, P Chris

    2014-12-01

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  12. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    Energy Technology Data Exchange (ETDEWEB)

    Berger, Andrew J., E-mail: berger.156@osu.edu; Page, Michael R.; Young, Justin R.; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris [Department of Physics, The Ohio State University, Columbus, Ohio 43210 (United States); Jacob, Jan [Werum Software and Systems CIS AG, Wulf-Werum-Straße 3, 21337 Lüneburg (Germany); Lewis, Jim; Wenzel, Lothar [National Instruments, Austin, Texas 78759 (United States)

    2014-12-15

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  13. A versatile LabVIEW and field-programmable gate array-based scanning probe microscope for in operando electronic device characterization

    Science.gov (United States)

    Berger, Andrew J.; Page, Michael R.; Jacob, Jan; Young, Justin R.; Lewis, Jim; Wenzel, Lothar; Bhallamudi, Vidya P.; Johnston-Halperin, Ezekiel; Pelekhov, Denis V.; Hammel, P. Chris

    2014-12-01

    Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.

  14. Combined laser and atomic force microscope lithography on aluminum: Mask fabrication for nanoelectromechanical systems

    DEFF Research Database (Denmark)

    Berini, Abadal Gabriel; Boisen, Anja; Davis, Zachary James

    1999-01-01

    A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production of nanoelectromecha......A direct-write laser system and an atomic force microscope (AFM) are combined to modify thin layers of aluminum on an oxidized silicon substrate, in order to fabricate conducting and robust etch masks with submicron features. These masks are very well suited for the production...

  15. Midinfrared absorption measured at a lambda/400 resolution with an atomic force microscope.

    Science.gov (United States)

    Houel, Julien; Homeyer, Estelle; Sauvage, Sébastien; Boucaud, Philippe; Dazzi, Alexandre; Prazeres, Rui; Ortéga, Jean-Michel

    2009-06-22

    Midinfrared absorption can be locally measured using a detection combining an atomic force microscope and a pulsed excitation. This is illustrated for the midinfrared bulk GaAs phonon absorption and for the midinfrared absorption of thin SiO(2) microdisks. We show that the signal given by the cantilever oscillation amplitude of the atomic force microscope follows the spectral dependence of the bulk material absorption. The absorption spatial resolution achieved with microdisks is around 50 nanometer for an optical excitation around 22 micrometer wavelength.

  16. Contrast and decay of cathodoluminescence from phosphor particles in a scanning electron microscope.

    Science.gov (United States)

    den Engelsen, Daniel; Harris, Paul G; Ireland, Terry G; Fern, George R; Silver, Jack

    2015-10-01

    Cathodoluminescence (CL) studies are reported on phosphors in a field emission scanning electron microscope (FESEM). ZnO: Zn and other luminescent powders manifest a bright ring around the periphery of the particles: this ring enhances the contrast. Additionally, particles resting on top of others are substantially brighter than underlying ones. These phenomena are explained in terms of the combined effects of electrons backscattered out of the particles, together with light absorption by the substrate. The contrast is found to be a function of the particle size and the energy of the primary electrons. Some phosphor materials exhibit a pronounced comet-like structure at high scan rates in a CL-image, because the particle continues to emit light after the electron beam has moved to a position without phosphor material. Image analysis has been used to study the loss of brightness along the tail and hence to determine the decay time of the materials. The effect of phosphor saturation on the determination of decay times by CL-microscopy was also investigated. Copyright © 2015 Elsevier B.V. All rights reserved.

  17. Examination of Scanning Electron Microscope and Computed Tomography Images of PICA

    Science.gov (United States)

    Lawson, John W.; Stackpoole, Margaret M.; Shklover, Valery

    2010-01-01

    Micrographs of PICA (Phenolic Impregnated Carbon Ablator) taken using a Scanning Electron Microscope (SEM) and 3D images taken with a Computed Tomography (CT) system are examined. PICA is a carbon fiber based composite (Fiberform ) with a phenolic polymer matrix. The micrographs are taken at different surface depths and at different magnifications in a sample after arc jet testing and show different levels of oxidative removal of the charred matrix (Figs 1 though 13). CT scans, courtesy of Xradia, Inc. of Concord CA, were captured for samples of virgin PICA, charred PICA and raw Fiberform (Fig. 14). We use these images to calculate the thermal conductivity (TC) of these materials using correlation function (CF) methods. CF methods give a mathematical description of how one material is embedded in another and is thus ideally suited for modeling composites like PICA. We will evaluate how the TC of the materials changes as a function of surface depth. This work is in collaboration with ETH-Zurich, which has expertise in high temperature materials and TC modeling (including CF methods).

  18. Autoregressive linear least square single scanning electron microscope image signal-to-noise ratio estimation.

    Science.gov (United States)

    Sim, Kok Swee; NorHisham, Syafiq

    2016-11-01

    A technique based on linear Least Squares Regression (LSR) model is applied to estimate signal-to-noise ratio (SNR) of scanning electron microscope (SEM) images. In order to test the accuracy of this technique on SNR estimation, a number of SEM images are initially corrupted with white noise. The autocorrelation function (ACF) of the original and the corrupted SEM images are formed to serve as the reference point to estimate the SNR value of the corrupted image. The LSR technique is then compared with the previous three existing techniques known as nearest neighbourhood, first-order interpolation, and the combination of both nearest neighborhood and first-order interpolation. The actual and the estimated SNR values of all these techniques are then calculated for comparison purpose. It is shown that the LSR technique is able to attain the highest accuracy compared to the other three existing techniques as the absolute difference between the actual and the estimated SNR value is relatively small. SCANNING 38:771-782, 2016. © 2016 Wiley Periodicals, Inc. © Wiley Periodicals, Inc.

  19. Pressure solution observed with an atomic force microscope

    Science.gov (United States)

    Colombani, J.; Pachon-Rodriguez, E. A.; Piednoir, A.

    2012-04-01

    Dissolution of minerals is involved in many geological and environmental processes, often with large human consequences. One can cite the durability of mineral materials, the management of nuclear wastes, the sequestration of atmospheric CO2 or the pollution of drinking water. Progresses have been made during the last decade in our understanding of the basic mechanisms of dissolution, particularly concerning the nature of the reactive surface, the role of etch pits, the influence of the mineral history, the mineral replacement processes, ... One of the remaining problems is the influence of an elastic stress on the nature and rate of dissolution. For instance a large discrepancy still exists between experimental results and modelling of pressure solution creep, a plastic strain mechanism of minerals based on the dissolution enhancement by an external stress. We present here an experimental evidence of the influence of a local stress on a molecular elementary mechanism of dissolution. This was performed by atomic force microscopy observation of the migration of a molecular step on the surface of a single crystal of gypsum during dissolution, where the AFM tip is used alternatively to apply a stress and probe the surface. The kinetics of this atomic mechanism is seen to obey the same law of pressure solution as the corresponding macroscopic phenomenon.

  20. Atomic force microscopic imaging of Acanthamoeba castellanii and Balamuthia mandrillaris trophozoites and cysts.

    Science.gov (United States)

    Aqeel, Yousuf; Siddiqui, Ruqaiyyah; Ateeq, Muhammad; Raza Shah, Muhammad; Kulsoom, Huma; Khan, Naveed Ahmed

    2015-01-01

    Light microscopy and electron microscopy have been successfully used in the study of microbes, as well as free-living protists. Unlike light microscopy, which enables us to observe living organisms or the electron microscope which provides a two-dimensional image, atomic force microscopy provides a three-dimensional surface profile. Here, we observed two free-living amoebae, Acanthamoeba castellanii and Balamuthia mandrillaris under the phase contrast inverted microscope, transmission electron microscope and atomic force microscope. Although light microscopy was of lower magnification, it revealed functional biology of live amoebae such as motility and osmoregulation using contractile vacuoles of the trophozoite stage, but it is of limited value in defining the cyst stage. In contrast, transmission electron microscopy showed significantly greater magnification and resolution to reveal the ultra-structural features of trophozoites and cysts including intracellular organelles and cyst wall characteristics but it only produced a snapshot in time of a dead amoeba cell. Atomic force microscopy produced three-dimensional images providing detailed topographic description of shape and surface, phase imaging measuring boundary stiffness, and amplitude measurements including width, height and length of A. castellanii and B. mandrillaris trophozoites and cysts. These results demonstrate the importance of the application of various microscopic methods in the biological and structural characterization of the whole cell, ultra-structural features, as well as surface components and cytoskeleton of protist pathogens. © 2014 The Author(s) Journal of Eukaryotic Microbiology © 2014 International Society of Protistologists.

  1. Microscopic techniques bridging between nanoscale and microscale with an atomically sharpened tip - field ion microscopy/scanning probe microscopy/ scanning electron microscopy.

    Science.gov (United States)

    Tomitori, Masahiko; Sasahara, Akira

    2014-11-01

    Over a hundred years an atomistic point of view has been indispensable to explore fascinating properties of various materials and to develop novel functional materials. High-resolution microscopies, rapidly developed during the period, have taken central roles in promoting materials science and related techniques to observe and analyze the materials. As microscopies with the capability of atom-imaging, field ion microscopy (FIM), scanning tunneling microscopy (STM), atomic force microscopy (AFM) and transmission electron microscopy (TEM) can be cited, which have been highly evaluated as methods to ultimately bring forward the viewpoint of reductionism in materials science. On one hand, there have been difficulties to derive useful and practical information on large (micro) scale unique properties of materials using these excellent microscopies and to directly advance the engineering for practical materials. To make bridges over the gap between an atomic scale and an industrial engineering scale, we have to develop emergence science step-by-step as a discipline having hierarchical structures for future prospects by combining nanoscale and microscale techniques; as promising ways, the combined microscopic instruments covering the scale gap and the extremely sophisticated methods for sample preparation seem to be required. In addition, it is noted that spectroscopic and theoretical methods should implement the emergence science.Fundamentally, the function of microscope is to determine the spatial positions of a finite piece of material, that is, ultimately individual atoms, at an extremely high resolution with a high stability. To define and control the atomic positions, the STM and AFM as scanning probe microscopy (SPM) have successfully demonstrated their power; the technological heart of SPM lies in an atomically sharpened tip, which can be observed by FIM and TEM. For emergence science we would like to set sail using the tip as a base. Meanwhile, it is significant

  2. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

    National Research Council Canada - National Science Library

    Sangmin An Baekman Sung Haneol Noh Corey Stambaugh Soyoung Kwon Kunyoung Lee Bongsu Kim Qhwan Kim Wonho Jhe

    2014-01-01

    ...) combined with a nanopipette-based quartz tuning fork atomic force microscope(nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions...

  3. Position-resolved Surface Characterization and Nanofabrication Using an Optical Microscope Combined with a Nanopipette/Quartz Tuning Fork Atomic Force Microscope

    National Research Council Canada - National Science Library

    An, Sangmin; Sung, Baekman; Noh, Haneol; Stambaugh, Corey; Kwon, Soyoung; Lee, Kunyoung; Kim, Bongsu; Kim, Qhwan; Jhe, Wonho

    2014-01-01

    ...) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions...

  4. Micromachined fountain pen as a tool for atomic force microscope-based nanoelectrochemical metal deposition

    NARCIS (Netherlands)

    Deladi, S.; Tas, Niels Roelof; Berenschot, Johan W.; de Boer, Meint J.; Krijnen, Gijsbertus J.M.; Elwenspoek, Michael Curt; de Boer, J.H.

    2005-01-01

    We present a device that enables nanoelectrochemical deposition using atomic force microscope. The micromachined fountain pen is a probe that consists of a fluidic reservoir, fluidic channels encapsulated in cantilevers and a pyramidal probe tip by which the fluid transfer to the sample surface

  5. Nano Goes to School: A Teaching Model of the Atomic Force Microscope

    Science.gov (United States)

    Planinsic, Gorazd; Kovac, Janez

    2008-01-01

    The paper describes a teaching model of the atomic force microscope (AFM), which proved to be successful in the role of an introduction to nanoscience in high school. The model can demonstrate the two modes of operation of the AFM (contact mode and oscillating mode) as well as some basic principles that limit the resolution of the method. It can…

  6. Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

    Science.gov (United States)

    Fink, Samuel D [Aiken, SC; Fondeur, Fernando F [North Augusta, SC

    2011-10-18

    An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

  7. An atomic force microscope operating at hypergravity for in situ measurement of cellular mechano-response

    NARCIS (Netherlands)

    van Loon, J.J.W.A.; van Laar, M.C.; Korterik, J.P.; Segerink, F.B.; Wubbels, R.J.; de Jong, H.A.A.; van Hulst, N.F.

    2009-01-01

    We present a novel atomic force microscope (AFM) system, operational in liquid at variable gravity, dedicated to image cell shape changes of cells in vitro under hypergravity conditions. The hypergravity AFM is realized by mounting a stand-alone AFM into a large-diameter centrifuge. The balance

  8. A Computer-Controlled Classroom Model of an Atomic Force Microscope

    Science.gov (United States)

    Engstrom, Tyler A.; Johnson, Matthew M.; Eklund, Peter C.; Russin, Timothy J.

    2015-01-01

    The concept of "seeing by feeling" as a way to circumvent limitations on sight is universal on the macroscopic scale--reading Braille, feeling one's way around a dark room, etc. The development of the atomic force microscope (AFM) in 1986 extended this concept to imaging in the nanoscale. While there are classroom demonstrations that use…

  9. Method for determining a spring constant for a deformable scanning probe microscope element, and scanning probe microscope and calibration device arranged for determining a spring constant for a probe element

    NARCIS (Netherlands)

    Sadeghian, H.; Yang, C.K.; Bossche, A.; French, P.J.; Goosen, J.F.L.; Van Keulen, A.

    2012-01-01

    A method for determining a spring constant k for a deformable probe element (102) of a scanning probe microscope SPM (100). The probe (102) has an outer surface area consisting of a tip area (112) on a first probe side (108) and a tip-less area (113). The probe (102) also has a probe electrode (114)

  10. Quantitative imaging of graphene impedance with the near-field scanning microwave microscope.

    Energy Technology Data Exchange (ETDEWEB)

    Kalugin, Nikolai G. (New Mexico Tech, Socorro, NM); Gonzales, Edward; Kalichava, Irakli (New Mexico Tech, Socorro, NM); Gin, Aaron V.; Wickey, Lee (New Mexico Tech, Socorro, NM); Del Barga, Christopher (New Mexico Tech, Socorro, NM); Talanov, Vladimir V. (Neocera, LLC, Beltsville, MD); Shaner, Eric Arthur

    2010-07-01

    Graphene has emerged as a promising material for high speed nano-electronics due to the relatively high carrier mobility that can be achieved. To further investigate electronic transport in graphene and reveal its potential for microwave applications, we employed a near-field scanning microwave microscope with the probe formed by an electrically open end of a 4 GHz half-lambda parallel-strip transmission line resonator. Because of the balanced probe geometry, our microscope allows for truly localized quantitative characterization of various bulk and low-dimensional materials, with the response region defined by the one micron spacing between the two metallic strips at the probe tip. The single- and few-layer graphene flakes were fabricated by a mechanical cleavage method on 300-nm-thick silicon dioxide grown on low resistivity Si wafer. The flake thickness was determined using both AFM and Raman microscopies. We observe clear correlation between the near-field microwave and far-field optical images of graphene produced by the probe resonant frequency shift and thickness-defined color gradation, respectively. We show that the microwave response of graphene flakes is determined by the local sheet impedance, which is found to be predominantly active. Furthermore, we apply a quantitative electrodynamic model relating the probe resonant frequency shift to 2D conductivity of single- and few-layer graphene. From fitting a model to the experimental data we evaluate graphene sheet resistance as a function of thickness. Near-field scanning microwave microscopy can simultaneously image location, geometry, thickness, and distribution of electrical properties of graphene without a need for device fabrication. The approach may be useful for design of graphene-based microwave transistors, quality control of large area graphene sheets, or investigation of chemical and electrical doping effects on graphene transport properties. We acknowledge support from the DOE Center for

  11. Analysis of the influence of the applied voltage and the scan speed in the atomic force microscopy local oxidation technique

    Science.gov (United States)

    Mendoza, C.; Plata, A.; Lizarazo, Z.; Chacón, C. A.

    2016-02-01

    The local nanolithography oxidation technique is implemented by using an atomic force microscope (AFM) for the fabrication of nanoscale patterning structures on a silicon substrate covered whit a thin film of silicon nitride. During the fabrication process, the microscope is operated on air and contact mode utilizing a silicon tip covered whit a hard Cobalt- Chromium coat. The dependence of the oxide growth with the applied voltage was investigated varying this parameter in a range of 1 to 10V to constant scanning speed; the influence of the writing speed in the dimensions of the oxide formed is also analysed varying the speed values between 0.1 to 1μm/s. Is found that the dimensions of lines depend of scanning speed and voltages applied.

  12. Influence of measuring parameters on the accuracy of atomic force microscope in industrial applications

    DEFF Research Database (Denmark)

    Tosello, Guido; Antico, Andrea; Hansen, Hans Nørgaard

    2009-01-01

    as in the evaluation of final product characteristics. The paper considers quantitative application of AFM measurements for industrial applications. In particular the influence and subsequent optimization of scanning parameters on the precision of AFM maps is discussed, with particular attention to scan speed...... and interaction force when measuring a one-dimensional grating with triangular profile. The aim is then maximization of information from collected data and minimization of measurement variability and scan time. Optimized scan setting is then applied to measure surface defects of micro injection moulded components...

  13. Nanoscale Imaging of Whole Cells Using a Liquid Enclosure and a Scanning Transmission Electron Microscope

    Science.gov (United States)

    Peckys, Diana B.; Veith, Gabriel M.; Joy, David C.; de Jonge, Niels

    2009-01-01

    Nanoscale imaging techniques are needed to investigate cellular function at the level of individual proteins and to study the interaction of nanomaterials with biological systems. We imaged whole fixed cells in liquid state with a scanning transmission electron microscope (STEM) using a micrometer-sized liquid enclosure with electron transparent windows providing a wet specimen environment. Wet-STEM images were obtained of fixed E. coli bacteria labeled with gold nanoparticles attached to surface membrane proteins. Mammalian cells (COS7) were incubated with gold-tagged epidermal growth factor and fixed. STEM imaging of these cells resulted in a resolution of 3 nm for the gold nanoparticles. The wet-STEM method has several advantages over conventional imaging techniques. Most important is the capability to image whole fixed cells in a wet environment with nanometer resolution, which can be used, e.g., to map individual protein distributions in/on whole cells. The sample preparation is compatible with that used for fluorescent microscopy on fixed cells for experiments involving nanoparticles. Thirdly, the system is rather simple and involves only minimal new equipment in an electron microscopy (EM) laboratory. PMID:20020038

  14. Nanoscale imaging of whole cells using a liquid enclosure and a scanning transmission electron microscope.

    Directory of Open Access Journals (Sweden)

    Diana B Peckys

    2009-12-01

    Full Text Available Nanoscale imaging techniques are needed to investigate cellular function at the level of individual proteins and to study the interaction of nanomaterials with biological systems. We imaged whole fixed cells in liquid state with a scanning transmission electron microscope (STEM using a micrometer-sized liquid enclosure with electron transparent windows providing a wet specimen environment. Wet-STEM images were obtained of fixed E. coli bacteria labeled with gold nanoparticles attached to surface membrane proteins. Mammalian cells (COS7 were incubated with gold-tagged epidermal growth factor and fixed. STEM imaging of these cells resulted in a resolution of 3 nm for the gold nanoparticles. The wet-STEM method has several advantages over conventional imaging techniques. Most important is the capability to image whole fixed cells in a wet environment with nanometer resolution, which can be used, e.g., to map individual protein distributions in/on whole cells. The sample preparation is compatible with that used for fluorescent microscopy on fixed cells for experiments involving nanoparticles. Thirdly, the system is rather simple and involves only minimal new equipment in an electron microscopy (EM laboratory.

  15. Dark field imaging of biological macromolecules with the scanning transmission electron microscope

    Science.gov (United States)

    Ohtsuki, Mitsuo; Isaacson, Michael S.; Crewe, A. V.

    1979-01-01

    A scanning transmission electron microscope (STEM) equipped with a field emission gun has been employed for the examination of biological macromolecules at high resolution. The quality of micrographs obtained with the STEM is dependent upon the quality of the substrate used to support biological objects because the image contrast in dark field is proportional to the mass density of the specimen. In order to reduce deleterious effects of the substrates on the image quality, we have developed a method of fabricating substrates consisting of very thin, very clean carbon films supported on very clean fenestrated plastic films. These films are approximately 15 Å thick. Well-known biological macromolecules such as glutamine synthetase and tobacco mosaic virus (both stained) and low-density lipoprotein and ferritin (both unstained were placed on these substrates and examined with the STEM by using various modes of contrast. The micrographs obtained by using the dark field mode of contrast employing an annular detector were free from phase contrast, as expected. Using this contrast mode, we have been able to directly observe (in-focus) 2.5- to 4.4-Å lattice spacings in the ferritin core. The effect of electron radiation damage on the helical structure of tobacco mosaic virus was also examined. Micrographs as well as corresponding optical diffraction patterns obtained with moderately low doses showed very clear helical structure from both sides of the virus. In addition, the (11.5 Å)-1 layer lines indicated the effective resolution attained on these particles. Images PMID:35788

  16. Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Trimby, Patrick W., E-mail: patrick.trimby@sydney.edu.au [Australian Centre for Microscopy and Microanalysis, The University of Sydney, Madsen Building F09 Sydney, NSW 2006 (Australia)

    2012-09-15

    In this study, the new technique of transmission Kikuchi diffraction (TKD) in the scanning electron microscope (SEM) has been applied for the first time to enable orientation mapping of bulk, nanostructured metals. The results show how the improved spatial resolution of SEM-TKD, compared to conventional EBSD, enables reliable mapping of truly nanostructured metals and alloys, with mean grain sizes in the 40-200 nm range. The spatial resolution of the technique is significantly below 10 nm, and contrasting examples are shown from both dense (Ni) and lighter (Al-alloy) materials. Despite the burden of preparing thin, electron-transparent samples, orientation mapping using SEM-TKD is likely to become invaluable for routine characterisation of nanocrystalline and, potentially, highly deformed microstructures. -- Highlights: Black-Right-Pointing-Pointer First report of orientation mapping by transmission Kikuchi diffraction in the SEM. Black-Right-Pointing-Pointer The SEM-TKD technique can achieve an effective spatial resolution of 2-4 nm. Black-Right-Pointing-Pointer Nanostructured Ni with a mean grain size of <50 nm has been effectively mapped. Black-Right-Pointing-Pointer Highly deformed Al-alloy, with sub-200 nm grains, has also been characterized. Black-Right-Pointing-Pointer The sample thickness is critical for effective results: ideally 75-200 nm for Al.

  17. Mass mapping of a protein complex with the scanning transmission electron microscope.

    Science.gov (United States)

    Engel, A; Baumeister, W; Saxton, W O

    1982-01-01

    A mass map of the hexagonally packed intermediate layer (HPI-layer), a regular protein monolayer from the cell envelope of Micrococcus radiodurans, has been obtained by scanning transmission electron microscopy. Samples were freeze-dried within the microscope, and low-dose images were recorded in the dark-field mode directly in digital form and processed by correlation averaging. The averaged projection of the unstained structure--i.e., the mass map--thus calculated shows a resolution to 3-nm period and reveals morphological features consistent with those obtained by negative staining. The mass of individual morphological domains was extracted by using variously the mass map itself or an average from a negatively stained HPI layer to define the domain boundaries. Protrusions as small as 1,300 daltons could be measured reproducibly within the unit cell of 655,000 daltons. The method developed opens an avenue to identify molecular species in situ and to correlate topographic information with biochemical data. Images PMID:6955791

  18. A 30 mK, 13.5 T scanning tunneling microscope with two independent tips

    Science.gov (United States)

    Roychowdhury, Anita; Gubrud, M. A.; Dana, R.; Anderson, J. R.; Lobb, C. J.; Wellstood, F. C.; Dreyer, M.

    2014-04-01

    We describe the design, construction, and performance of an ultra-low temperature, high-field scanning tunneling microscope (STM) with two independent tips. The STM is mounted on a dilution refrigerator and operates at a base temperature of 30 mK with magnetic fields of up to 13.5 T. We focus on the design of the two-tip STM head, as well as the sample transfer mechanism, which allows in situ transfer from an ultra high vacuum preparation chamber while the STM is at 1.5 K. Other design details such as the vibration isolation and rf-filtered wiring are also described. Their effectiveness is demonstrated via spectral current noise characteristics and the root mean square roughness of atomic resolution images. The high-field capability is shown by the magnetic field dependence of the superconducting gap of CuxBi2Se3. Finally, we present images and spectroscopy taken with superconducting Nb tips with the refrigerator at 35 mK that indicate that the effective temperature of our tips/sample is approximately 184 mK, corresponding to an energy resolution of 16 μeV.

  19. Vertical marginal discrepancies of metal castings obtained using different pattern materials: A scanning electron microscope study

    Directory of Open Access Journals (Sweden)

    R Sushma

    2014-01-01

    Full Text Available Background and Objectives: Dental Casting involves various stages of processing, out of which any may affect the dimensional accuracy. The fit of a casting depends not only on the method of fabrication employed but also on the type of materials utilized. One important variable in the casting process is the type of pattern material employed. This study was carried out to determine and compare the effect of different pattern materials on the vertical marginal accuracy of complete cast crowns. Materials and Methods: A standardized metal master die simulating a prepared crown was used to prepare 60 models on which patterns were fabricated using Inlay Pattern Wax; Auto-polymerized Pattern Resin and Light Cured Modeling Resin and cast immediately. Castings of the patterns were subjected to analysis of marginal fit using a scanning electron microscope (SEM. Results: One-way ANOVA result showed a significant difference in the gap observed between the castings fabricated using the three types of pattern materials (P 0.05. Conclusion: With strict adherence to the principles of pattern fabrication and immediate casting, Inlay wax can still be the pattern material of choice to produce a casting with minimal marginal discrepancy with added advantages of being user friendly and cost effective.

  20. Ultra-morphology of root surface subsequent to periodontal instrumentation: A scanning electron microscope study

    Directory of Open Access Journals (Sweden)

    Parveen Dahiya

    2012-01-01

    Full Text Available Background: The aim of this study was to compare root surface characteristic following root planing with various hand and power driven instruments. Materials and Methods: A total of 20 single rooted teeth were used in this study, of which two specimens were used as control (no instrumentation done and remaining 18 specimens were equally divided into three groups. Specimens from each group were then subjected to root planing by one of the following instruments: (1 a Gracey curette (2 Ultrasonic tip and (3 a Rotary bur. In each case, the time required for scaling and root planing was measured. After treatment, the specimens were observed under scanning electron microscope and surface roughness was measured by using Roughness and loss of tooth substance index (RLTSI. Results: The mean RLTSI scores for Gracey curette, ultrasonic and rotary instrument group were 2.5, 2.0 and 0.667 respectively. The mean scores of time spent for scaling and root planing by Gracey curette, ultrasonic and rotary instrument group in seconds were 42.50, 35.83 and 54.50. Conclusion: All the three instruments namely Gracey curette, Ultrasonic tip and Rotary bur were effective in mechanical debridement of root surface. The results favoured the use of rotary instruments for root planing to achieve smooth clean root surface; however, the use of rotary instrument was more time consuming which might limit its use in clinical practice.

  1. Somatic Embryos in Catharanthus roseus: A Scanning Electron Microscopic Study

    Directory of Open Access Journals (Sweden)

    Junaid ASLAM

    2014-06-01

    Full Text Available Catharanthus roseus (L. G. Don is an important medicinal plant as it contains several anti-cancerous compounds, like vinblastine and vincristine. Plant tissue culture technology (organogenesis and embryogenesis has currently been used in fast mass propagating raw materials for secondary metabolite synthesis. In this present communication, scanning electron microscopic (SEM study of somatic embryos was conducted and discussed. The embryogenic callus was first induced from hypocotyls of in vitro germinated seeds on which somatic embryos, differentiated in numbers, particularly on 2,4-D (1.0 mg/L Murashige and Skoog (MS was medium. To understand more about the regeneration method and in vitro formed embryos SEM was performed. The SEM study revealed normal somatic embryo origin and development from globular to heart-, torpedo- and then into cotyledonary-stage of embryos. At early stage, the embryos were clustered together in a callus mass and could not easily be detached from the parental tissue. The embryos were often long cylindrical structure with or without typical notch at the tip. Secondary embryos were also formed on primary embryo structure. The advanced cotyledonary embryos showed prominent roots and shoot axis, which germinated into plantlets. The morphology, structure and other details of somatic embryos at various stages were presented.

  2. Assessing the efficacy of citrus aurantifolia extract on smear layer removal with scanning electron microscope.

    Science.gov (United States)

    Bolhari, Behnam; Sharifian, Mohammad Reza; Aminsobhani, Mohsen; Monsef Esfehani, Hamid Reza; Tavakolian, Pardis

    2012-01-01

    The purpose of this study was to determine the effects of citrus aurantifolia (CA) extract on smear layer removal in different parts of root canals. Thirty-nine single-rooted human teeth were randomly divided into three experimental (n=12) and one control (n=3) groups. Teeth were instrumented using MTwo rotary instruments. Root canals were irrigated with NaOCl during instrumentation. The canals in each group were irrigated with one of the following: completed mixture of citrus aurantifolia extracts, 17% EDTA, and alcoholic extract of CA. Distilled water was used for the control group. The irrigants were left within the canal for 20 minutes, and then rinsed with normal saline solution. Teeth were subsequently split longitudinally into 2 halves, and the canals were examined by a scanning electron-microscope. Cleanliness was evaluated using a five point scoring system. Statistical significant difference was found between groups (Pcitrus aurantifolia extracts were not able to effectively remove smear layer compared with 17% EDTA during root canal therapy.

  3. Development of in situ two-coil mutual inductance technique in a multifunctional scanning tunneling microscope

    Science.gov (United States)

    Duan, Ming-Chao; Liu, Zhi-Long; Ge, Jian-Feng; Tang, Zhi-Jun; Wang, Guan-Yong; Wang, Zi-Xin; Guan, Dandan; Li, Yao-Yi; Qian, Dong; Liu, Canhua; Jia, Jin-Feng

    2017-07-01

    Superconducting thin films have been a focal point for intensive research efforts since their reduced dimension allows for a wide variety of quantum phenomena. Many of these films, fabricated in UHV chambers, are highly vulnerable to air exposure, making it difficult to measure intrinsic superconducting properties such as zero resistance and perfect diamagnetism with ex situ experimental techniques. Previously, we developed a multifunctional scanning tunneling microscope (MSTM) containing in situ four-point probe (4PP) electrical transport measurement capability in addition to the usual STM capabilities [Ge et al., Rev. Sci. Instrum. 86, 053903 (2015)]. Here we improve this MSTM via development of both transmission and reflection two-coil mutual inductance techniques for in situ measurement of the diamagnetic response of a superconductor. This addition does not alter the original STM and 4PP functions of the MSTM. We demonstrate the performance of the two-coil mutual inductance setup on a 10-nm-thick NbN thin film grown on a Nb-doped SrTiO3(111) substrate.

  4. Miniature Variable Pressure Scanning Electron Microscope for In-Situ Imaging and Chemical Analysis

    Science.gov (United States)

    Gaskin, Jessica A.; Jerman, Gregory; Gregory, Don; Sampson, Allen R.

    2012-01-01

    NASA Marshall Space Flight Center (MSFC) is leading an effort to develop a Miniaturized Variable Pressure Scanning Electron Microscope (MVP-SEM) for in-situ imaging and chemical analysis of uncoated samples. This instrument development will be geared towards operation on Mars and builds on a previous MSFC design of a mini-SEM for the moon (funded through the NASA Planetary Instrument Definition and Development Program). Because Mars has a dramatically different environment than the moon, modifications to the MSFC lunar mini-SEM are necessary. Mainly, the higher atmospheric pressure calls for the use of an electron gun that can operate at High Vacuum, rather than Ultra-High Vacuum. The presence of a CO2-rich atmosphere also allows for the incorporation of a variable pressure system that enables the in-situ analysis of nonconductive geological specimens. Preliminary testing of Mars meteorites in a commercial Environmental SEM(Tradmark) (FEI) confirms the usefulness of lowcurrent/low-accelerating voltage imaging and highlights the advantages of using the Mars atmosphere for environmental imaging. The unique capabilities of the MVP-SEM make it an ideal tool for pursuing key scientific goals of NASA's Flagship Mission Max-C; to perform in-situ science and collect and cache samples in preparation for sample return from Mars.

  5. Inducing superconductivity at a nanoscale: photodoping with a near-field scanning optical microscope.

    Science.gov (United States)

    Decca, R S; Drew, H D; Maiorov, B; Guimpel, J; Osquiguil, E J

    1999-01-01

    The local modification of an insulating GdBa2Cu3O6.5 thin film, made superconducting by illumination with a near-field scanning optical microscope (NSOM), is reported. A 100-nm aperture NSOM probe acts as a sub-wavelength light source of wavelength lambda(exc) = 480-650 nm, locally generating photocarriers in an otherwise insulating GdBa2-Cu3O6.5 thin film. Of the photogenerated electron-hole pairs, electrons are trapped in the crystallographic lattice, defining an electrostatic confining potential to enable the holes to move. Reflectance measurements at lambda = 1.55 microm at room temperature show that photocarriers can be induced and constrained to move on a approximately 200 nm scale for all investigated lambda(exc). Photogenerated wires present a superconducting critical temperature Tc= 12 K with a critical current density Jc = 10(4) A cm(-2). Exploiting the flexibility provided by photodoping through a NSOM probe, a junction was written by photodoping a wire with a narrow (approximately 50 nm) under-illuminated gap. The strong magnetic field modulation of the critical current provides a clear signature of the existence of a Josephson effect in the junction.

  6. A scanning electron microscopic and microradiographic study of pits in fluorosed human enamel.

    Science.gov (United States)

    Thylstrup, A; Fejerskov, O

    1979-04-01

    The aim of the present study has been to correlate the surface appearance of pitted, fluorosed enamel in the scanning electron microscope (SEM) with the microradiographic features of the underlying tissue. Intact enamel surfaces of severely fluorosed teeth appeared similar to that of normal enamel. In the unabraded surfaces discrete pits were sharply demarcated from the surrounding intact enamel surface leaving steep walls of parallel running rods. The microradiographic appearance of sections made through pits indicated that focal loss of surface enamel occurred corresponding to the inner highly hypomineralized part of the fluorotic subsurface lesion. The abrupt wall formation and the finding that the striae of Retzius never changed direction along the margins of the lesions indicated that pits in fluorosed enamel may be secondarily produced defects rather than true hypoplasias. Further evidence of the posteruptive origin of the defects was derived from the observation that enamel lamellae occasionally formed part of the lateral border. The relatively higher degree of radiopacity observed in the tissue surrounding the pit indicates a posteruptively acquired deposition of minerals in the exposed porous enamel.

  7. Confocal laser scanning microscopic investigation of ultrasonic, sonic, and rotary sealer placement techniques

    Science.gov (United States)

    Nikhil, Vineeta; Singh, Renuka

    2013-01-01

    Background: Sealers are used to attain an impervious seal between the core material and root canal walls. Aim: To compare the depth and percentage of sealer penetration with three different placement techniques using confocal laser scanning microscopy as the evaluative tool. Materials and Methods: Root canals of 30 single-rooted teeth were prepared to a size of F3 and AH plus sealer with Rhodamine B was applied with Ultlrasonic file (Gr-1), lentulospiral (Gr-2), and Endoactivator (Gr-3). Canals were obturated with gutta-percha. The roots were sectioned at the 3 and 6-mm levels from the apical foramen and were examined on a confocal microscope. Results: A statistical significant differences among Gr-1, Gr-2, and Gr-3 were found at the 3 and 6-mm level (P < 0.05; ANOVA-Tukey tests) for the depth and percentage of sealer penetration except for Gr-1 and Gr-2 at 3-mm level. Gr-1 showed maximum mean depth of penetration (810 μm) and maximum mean percentage of sealer penetration (64.5) while Gr-3 showed minimum mean depth of penetration (112.7 μm) and minimum mean percentage of sealer penetration (26.7). Conclusion: Depth and percentage of penetration of sealer is influenced by the type of placement technique and by the root canal level with penetration decreasing apically. PMID:23956528

  8. Subcellular localization of flavonol aglycone in hepatocytes visualized by confocal laser scanning fluorescence microscope.

    Science.gov (United States)

    Mukai, Rie; Shirai, Yasuhito; Saito, Naoaki; Yoshida, Ken-Ichi; Ashida, Hitoshi

    2009-04-01

    Flavonoids are widely distributed in the plant kingdom and show various biological activities. The bioavailability of flavonoids in biological samples has conventionally been quantified by high-performance liquid chromatography and mass spectrometry, but with these analytical techniques it is difficult to estimate the subcellular localization of flavonoids in intact cells. In this study, we attempted to examine the localization of flavonoids in cultured cells using a confocal laser scanning fluorescence microscope and mouse hepatoma Hepa-1c1c7 cells. Five flavonol aglycones showed autofluorescence in the cells under the conditions (Ex. 488 nm to Em. 515-535 nm), whereas three flavonol glycosides and eight compounds belonging to other flavonoid subclasses, i.e., flavones, flavanones, and catechins, did not. The autofluorescence of galangin and kaempferol appeared stronger in the nucleus than cytoplasm, suggesting that they are incorporated into the cells and accumulated in the nucleus. The proposed method provided evidence that flavonol aglycones are incorporated into, and accumulated in the nucleus of, hepatocytes.

  9. Homebuilt single-molecule scanning confocal fluorescence microscope studies of single DNA/protein interactions.

    Science.gov (United States)

    Zheng, Haocheng; Goldner, Lori S; Leuba, Sanford H

    2007-03-01

    Many technical improvements in fluorescence microscopy over the years have focused on decreasing background and increasing the signal to noise ratio (SNR). The scanning confocal fluorescence microscope (SCFM) represented a major improvement in these efforts. The SCFM acquires signal from a thin layer of a thick sample, rejecting light whose origin is not in the focal plane thereby dramatically decreasing the background signal. A second major innovation was the advent of high quantum-yield, low noise, single-photon counting detectors. The superior background rejection of SCFM combined with low-noise, high-yield detectors makes it possible to detect the fluorescence from single-dye molecules. By labeling a DNA molecule or a DNA/protein complex with a donor/acceptor dye pair, fluorescence resonance energy transfer (FRET) can be used to track conformational changes in the molecule/complex itself, on a single molecule/complex basis. In this methods paper, we describe the core concepts of SCFM in the context of a study that uses FRET to reveal conformational fluctuations in individual Holliday junction DNA molecules and nucleosomal particles. We also discuss data processing methods for SCFM.

  10. Simultaneous imaging of multiple focal planes in scanning two-photon absorption microscope by photon counting

    Science.gov (United States)

    Carriles, Ramón; Hoover, Erich E.; Amir, Wafa; Squier, Jeffery A.

    2007-09-01

    We demonstrate a two-photon absorption scanning microscope capable of imaging two focal planes simultaneously. The 23MHz fundamental laser is split in two, one part delayed in time while the other is focused with a deformable mirror to change its divergence. Both parts are then recombined to form a 46MHz pulse train consisting of two interlaced trains with different divergences that after the objective are focused at different sample depths. At the detection path, photon counting techniques allow photons coming from each depth to be separated based on their relative timing with respect to the 46MHz train. The separation is accomplished using a field-programmable gate array that has been programmed to switch back and forth between two counters at a rate provided by a master clock generated by the 46MHz pulse train. The computer that controls the scanners reads and resets the counters before moving to a new pixel. The scheme is demonstrated for two depths but can be extended to a larger number, the ultimate limit being the fluorescence lifetime. This technique could also be implemented for second or third harmonic generation microscopy, in this case the ultimate achievable number of focal planes would be determined by the electronics speed.

  11. Improved design for a low temperature scanning tunneling microscope with an in situ tip treatment stage

    Science.gov (United States)

    Kim, J.-J.; Joo, S. H.; Lee, K. S.; Yoo, J. H.; Park, M. S.; Kwak, J. S.; Lee, Jinho

    2017-04-01

    The Low Temperature Scanning Tunneling Microscope (LT-STM) is an extremely valuable tool not only in surface science but also in condensed matter physics. For years, numerous new ideas have been adopted to perfect LT-STM performances—Ultra-Low Vibration (ULV) laboratory and the rigid STM head design are among them. Here, we present three improvements for the design of the ULV laboratory and the LT-STM: tip treatment stage, sample cleaving stage, and vibration isolation system. The improved tip treatment stage enables us to perform field emission for the purpose of tip treatment in situ without exchanging samples, while our enhanced sample cleaving stage allows us to cleave samples at low temperature in a vacuum without optical access by a simple pressing motion. Our newly designed vibration isolation system provides efficient space usage while maintaining vibration isolation capability. These improvements enhance the quality of spectroscopic imaging experiments that can last for many days and provide increased data yield, which we expect can be indispensable elements in future LT-STM designs.

  12. Scanning microscopic study on the effects of radiation on the laryngeal mucosa of human and rat

    Energy Technology Data Exchange (ETDEWEB)

    Taniguchi, T. (Mie Univ., Tsu (Japan). School of Medicine)

    1981-05-01

    The fine surface structure of the laryngeal mucosa of humans and rats was investigated by using a scanning electron microscope and an X-ray microanalyser. Experimental materials were obtained from human patients who were treated with doses of 3000r to 4000r for laryngeal cancer and rats which had been raised on a normal diet or a diet deprived of vitamin E. These rats were experimentally irradiated with doses of 1000r to 1500r. Significant changes on the laryngeal surface of the humans were seen on the supraglottic areas and ventricular cavity which were composed of nonciliated cells. There was loss of nonciliated cells from the surface and tightly packed microvilli on the surface. In some areas of the ciliated laryngeal epithelium, there were compound cilia, bleb-formation, polyp-like formation of cilia, and/or shortened cilia. The surface structure of the larynges of the rats experimentally irradiated rat with doses of 1000r to 1500r showed similar findings to those of the humans. They were especially prominent in the vitamin E-defficient rats. The surface structure of laryngeal cancer treated with radiation showed a bulging formation of cells, an irregular surface of intercellular space. In the biochemical study using an X-ray microanalyser, phosphorus and sulfur were found more frequently on the laryngeal cancer than on the intact larynx.

  13. Scanning Electron Microscope-Cathodoluminescence Analysis of Rare-Earth Elements in Magnets.

    Science.gov (United States)

    Imashuku, Susumu; Wagatsuma, Kazuaki; Kawai, Jun

    2016-02-01

    Scanning electron microscope-cathodoluminescence (SEM-CL) analysis was performed for neodymium-iron-boron (NdFeB) and samarium-cobalt (Sm-Co) magnets to analyze the rare-earth elements present in the magnets. We examined the advantages of SEM-CL analysis over conventional analytical methods such as SEM-energy-dispersive X-ray (EDX) spectroscopy and SEM-wavelength-dispersive X-ray (WDX) spectroscopy for elemental analysis of rare-earth elements in NdFeB magnets. Luminescence spectra of chloride compounds of elements in the magnets were measured by the SEM-CL method. Chloride compounds were obtained by the dropwise addition of hydrochloric acid on the magnets followed by drying in vacuum. Neodymium, praseodymium, terbium, and dysprosium were separately detected in the NdFeB magnets, and samarium was detected in the Sm-Co magnet by the SEM-CL method. In contrast, it was difficult to distinguish terbium and dysprosium in the NdFeB magnet with a dysprosium concentration of 1.05 wt% by conventional SEM-EDX analysis. Terbium with a concentration of 0.02 wt% in an NdFeB magnet was detected by SEM-CL analysis, but not by conventional SEM-WDX analysis. SEM-CL analysis is advantageous over conventional SEM-EDX and SEM-WDX analyses for detecting trace rare-earth elements in NdFeB magnets, particularly dysprosium and terbium.

  14. Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

    Directory of Open Access Journals (Sweden)

    Joon Huang Chuah

    2011-01-01

    Full Text Available This paper presents a novel method of detecting secondary electrons generated in the scanning electron microscope (SEM. The method suggests that the photomultiplier tube (PMT, traditionally used in the Everhart-Thornley (ET detector, is to be replaced with a configurable multipixel solid-state photon detector offering the advantages of smaller dimension, lower supply voltage and power requirements, and potentially cheaper product cost. The design of the proposed detector has been implemented using a standard 0.35 μm CMOS technology with optical enhancement. This microchip comprises main circuit constituents of an array of photodiodes connecting to respective noise-optimised transimpedance amplifiers (TIAs, a selector-combiner (SC circuit, and a postamplifier (PA. The design possesses the capability of detecting photons with low input optical power in the range of 1 nW with 100 μm × 100 μm sized photodiodes and achieves a total amplification of 180 dBΩ at the output.

  15. Observations of liver cancer cells in scanning probe acoustic microscope: a preliminary study

    Science.gov (United States)

    Chen, Xiaohui; Fang, Xiaoyue; Xi, Qing; Guo, Hua; Zhang, Ning; Ding, Mingyue

    2016-04-01

    Scanning probe acoustic microscope (SPAM) can be used to acquire the morphology image as well as the non-destructive internal structures acoustic image. However, the observations of the morphology image as well as the internal structures acoustic image of liver cancer cells in SPAM are few. In this paper, we cultured 4 different types of liver cancer cells on the silicon wafer and coverslip to observe their morphology images as well as acoustic images in SPAM, and made a preliminary study of the 8 types of cells specimens (hereinafter referred to as the silicon specimens and coverslips specimens). The experimental measurement results showed that some cellular pseudopodium were observed in the morphology images of the coverslip specimens while no such cellular pseupodium were appeared in the morphology images of the silicon specimens, which concluded that the living liver cancer cells were less likely to grow on the silicon wafer. SPAM provides a rapid and sensitive visual method for studying the morphology and internal structures of the cancer cells. The proposed method can be also used to obtain the morphology and internal information in both solid and soft material wafers, such as silicon and cells, with the resolution of nanometer scale.

  16. Sarcoglycan immunoreactivity is lacking in infantile hypertrophic pyloric stenosis. A confocal laser scanning microscopic study.

    Science.gov (United States)

    Romeo, C; Santoro, G; Impellizzeri, P; Manganaro, A; Cutroneo, G; Trimarchi, E; Antonuccio, P; Anastasi, G; Zuccarello, B

    2007-01-01

    The Dystrophin-Glycoprotein Complex (DGC) is a large multisubunit complex that plays a crucial role in maintaining the structural integrity and physiology of muscle fibers. Dystrophin has been reported to be absent in the pyloric muscle of infantile hypertrophic pyloric stenosis (IHPS) patients. The present study was designed to investigate the other two patterns of DGC (dystroglycan and sarcoglycan complexes) in normal pyloric muscle and their possible modifications in IHPS patients. Ten pyloric muscle biopsies were obtained from babies operated for IHPS and five control pylorus biopsy taken at autopsy from cases without gastrointestinal disease. The DGC sub-complexes (beta-dystroglican and beta, delta- sarcoglycans) were localized immunohistochemically using specific monoclonal antibodies. The results were evaluated using a confocal laser scanning microscope. Positive immunolocalization of the two DGC sub complexes was demonstrated in the smooth muscle cells (SMCs) of the pyloric region of control patients. Similarly, a positive immune expression of beta-dystroglican was observed in the pyloric SMCs of IHPS patients. On the other hand a negative immunoreaction for sarcoglycans was recorded within the full thickness of the pyloric SMCs of these patients. The absence of sarcoglycans within the hypertrophied pyloric muscle may be a predisposing factor in the pathogenesis of IHPS since it could alter the normal physiology of SMCs through the modifications of structural integrity of sarcolemma and signaling between the extracellular and intracellular compartment.

  17. Image sharpness measurement in the scanning electron-microscope--part III.

    Science.gov (United States)

    Zhang, N F; Postek, M T; Larrabee, R D; Vladár, A E; Keery, W J; Jones, S N

    1999-01-01

    Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an important aspect of quality control. The application of Fourier analysis techniques to the analysis of SEM images is a useful methodology for sharpness measurement. In this paper, a statistical measure known as the multivariate kurtosis is proposed as an additional useful measure of the sharpness of SEM images. Kurtosis is designed to be a measure of the degree of departure of a probability distribution. For selected SEM images, the two-dimensional spatial Fourier transforms were computed. Then the bivariate kurtosis of this Fourier transform was calculated as though it were a probability distribution. Kurtosis has the distinct advantage that it is a parametric (i.e., a dimensionless) measure and is sensitive to the presence of the high spatial frequencies necessary for acceptable levels of image sharpness. The applications of this method to SEM metrology will be discussed.

  18. Microscopic Theory for the Role of Attractive Forces in the Dynamics of Supercooled Liquids

    Science.gov (United States)

    Dell, Zachary E.; Schweizer, Kenneth S.

    2015-11-01

    We formulate a microscopic, no adjustable parameter, theory of activated relaxation in supercooled liquids directly in terms of the repulsive and attractive forces within the framework of pair correlations. Under isochoric conditions, attractive forces can nonperturbatively modify slow dynamics, but at high enough density their influence vanishes. Under isobaric conditions, attractive forces play a minor role. High temperature apparent Arrhenius behavior and density-temperature scaling are predicted. Our results are consistent with recent isochoric simulations and isobaric experiments on a deeply supercooled molecular liquid. The approach can be generalized to treat colloidal gelation and glass melting, and other soft matter slow dynamics problems.

  19. Soft x-ray spectromicroscopy using compact scanning transmission x-ray microscope at the photon factory

    Energy Technology Data Exchange (ETDEWEB)

    Takeichi, Yasuo, E-mail: yasuo.takeichi@kek.jp; Inami, Nobuhito; Ono, Kanta [High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan); Ueno, Tetsuro [National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047 (Japan); Suga, Hiroki [Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Takahashi, Yoshio [The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

    2016-07-27

    We report the stability and recent performances of a new type of scanning transmission X-ray microscopy. The optics and compact design of the microscope realized mobility and robust performance. Detailed consideration to the vibration control will be described. The insertion device upgraded to elliptical polarization undulator enabled linear dichroism and circular dichroism experiments.

  20. Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope

    Czech Academy of Sciences Publication Activity Database

    Vlašínová, H.; Neděla, Vilém; Dordevic, B.; Havel, J.

    2017-01-01

    Roč. 254, č. 4 (2017), s. 1487-1497 ISSN 0033-183X R&D Projects: GA ČR(CZ) GA14-22777S Institutional support: RVO:68081731 Keywords : somatic embryogenesis * pinus uncinata subsp uliginosa * abnormalities * environmental scanning electron microscope Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering Impact factor: 2.870, year: 2016

  1. Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope.

    Science.gov (United States)

    Yoon, Yeo Hun; Kim, Seung Jae; Kim, Dong Hwan

    2015-12-01

    The scanning electron microscope is used in various fields to go beyond diffraction limits of the optical microscope. However, the electron pathway should be conducted in a vacuum so as not to scatter electrons. The pretreatment of the sample is needed for use in the vacuum. To directly observe large and fully hydrophilic samples without pretreatment, the atmospheric scanning electron microscope (ASEM) is needed. We developed an electron filter unit and an electron detector unit for implementation of the ASEM. The key of the electron filter unit is that electrons are transmitted while air molecules remain untransmitted through the unit. The electron detector unit collected the backscattered electrons. We conducted experiments using the selected materials with Havar foil, carbon film and SiN film. © The Author 2015. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

  2. Minimizing pulling geometry errors in atomic force microscope single molecule force spectroscopy.

    Science.gov (United States)

    Rivera, Monica; Lee, Whasil; Ke, Changhong; Marszalek, Piotr E; Cole, Daniel G; Clark, Robert L

    2008-10-01

    In atomic force microscopy-based single molecule force spectroscopy (AFM-SMFS), it is assumed that the pulling angle is negligible and that the force applied to the molecule is equivalent to the force measured by the instrument. Recent studies, however, have indicated that the pulling geometry errors can drastically alter the measured force-extension relationship of molecules. Here we describe a software-based alignment method that repositions the cantilever such that it is located directly above the molecule's substrate attachment site. By aligning the applied force with the measurement axis, the molecule is no longer undergoing combined loading, and the full force can be measured by the cantilever. Simulations and experimental results verify the ability of the alignment program to minimize pulling geometry errors in AFM-SMFS studies.

  3. Geometric derivation of the microscopic stress: A covariant central force decomposition

    Science.gov (United States)

    Torres-Sánchez, Alejandro; Vanegas, Juan M.; Arroyo, Marino

    2016-08-01

    We revisit the derivation of the microscopic stress, linking the statistical mechanics of particle systems and continuum mechanics. The starting point in our geometric derivation is the Doyle-Ericksen formula, which states that the Cauchy stress tensor is the derivative of the free-energy with respect to the ambient metric tensor and which follows from a covariance argument. Thus, our approach to define the microscopic stress tensor does not rely on the statement of balance of linear momentum as in the classical Irving-Kirkwood-Noll approach. Nevertheless, the resulting stress tensor satisfies balance of linear and angular momentum. Furthermore, our approach removes the ambiguity in the definition of the microscopic stress in the presence of multibody interactions by naturally suggesting a canonical and physically motivated force decomposition into pairwise terms, a key ingredient in this theory. As a result, our approach provides objective expressions to compute a microscopic stress for a system in equilibrium and for force-fields expanded into multibody interactions of arbitrarily high order. We illustrate the proposed methodology with molecular dynamics simulations of a fibrous protein using a force-field involving up to 5-body interactions.

  4. Ultrastable combined atomic force and total internal reflection fluorescence microscope [corrected].

    Science.gov (United States)

    Gumpp, H; Stahl, S W; Strackharn, M; Puchner, E M; Gaub, H E

    2009-06-01

    Combining atomic force microscope (AFM) with other microscopy techniques has expanded the range of potential applications for single molecule investigations dramatically. Particularly hybrid instruments with total internal reflection fluorescence (TIRF) excitation have opened new routes in life sciences. Here we present a novel design for such a hybrid microscope, which overcomes the limitations of conventional combinations caused by their limited mechanical stability. A thorough analysis of the noise spectra and a comparison of the different designs and the different operation modes are given. With this instrument we demonstrate single molecule manipulation by AFM and simultaneous TIRF imaging.

  5. Humidity effects on scanning polarization force microscopy imaging

    Science.gov (United States)

    Shen, Yue; Zhou, Yuan; Sun, Yanxia; Zhang, Lijuan; Wang, Ying; Hu, Jun; Zhang, Yi

    2017-08-01

    Scanning polarization force microscopy (SPFM) is a useful surface characterization technique to visually characterize and distinguish nanomaterial with different local dielectric properties at nanometer scale. In this paper, taking the individual one-atom-thick graphene oxide (GO) and reduced graphene oxide (rGO) sheets on mica as examples, we described the influences of environmental humidity on SPFM imaging. We found that the apparent heights (AHs) or contrast of SPFM imaging was influenced significantly by relative humidity (RH) at a response time of a few seconds. And this influence rooted in the sensitive dielectric constant of mica surface to the RH change. While dielectric properties of GO and rGO sheets were almost immune to the humidity change. In addition, we gave the method to determine the critical humidity at which the contrast conversion happened under different conditions. And this is important to the contrast control and repeatable imaging of SPFM through RH adjusting. These findings suggest a strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM, which is critically important for further distinguishment, manipulation, electronic applications, etc.

  6. Electrochemical and scanning probe microscopic characterization of spontaneously adsorbed organothiolate monolayers at gold

    Energy Technology Data Exchange (ETDEWEB)

    Wong, Sze-Shun Season [Iowa State Univ., Ames, IA (United States)

    1999-12-10

    This dissertation presented several results which add to the general knowledge base regarding organothiolates monolayer spontaneously adsorbed at gold films. Common to the body of this work is the use of voltammetric reductive resorption and variants of scanning probe microscopy to gain insight into the nature of the monolayer formation process as well as the resulting interface. The most significant result from this work is the success of using friction force microscopy to discriminate the end group orientation of monolayer chemisorbed at smooth gold surfaces with micrometer resolution (Chapter 4). The ability to detect the differences in the orientational disposition is demonstrated by the use PDMS polymer stamp to microcontact print an adlayer of n-alkanethiolate of length n in a predefine pattern onto a gold surface, followed by the solution deposition of a n-alkanethiol of n ± 1 to fill in the areas on the gold surface intentionally not coated by the stamping process. These two-component monolayers can be discriminated by using friction force microscopy which detects differences in friction contributed by the differences in the orientation of the terminal groups at surfaces. This success has recently led to the detection of the orientation differences at nanometer scale. Although the substrates examined in this work consisted entirely of smooth gold films, the same test can be performed on other smooth substrates and monolayer materials.

  7. Spin microscope based on optically detected magnetic resonance

    Science.gov (United States)

    Berman, Gennady P.; Chernobrod, Boris M.

    2007-12-11

    The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.

  8. The FAST module: An add-on unit for driving commercial scanning probe microscopes at video rate and beyond

    Science.gov (United States)

    Esch, Friedrich; Dri, Carlo; Spessot, Alessio; Africh, Cristina; Cautero, Giuseppe; Giuressi, Dario; Sergo, Rudi; Tommasini, Riccardo; Comelli, Giovanni

    2011-05-01

    We present the design and the performance of the FAST (Fast Acquisition of SPM Timeseries) module, an add-on instrument that can drive commercial scanning probe microscopes (SPM) at and beyond video rate image frequencies. In the design of this module, we adopted and integrated several technical solutions previously proposed by different groups in order to overcome the problems encountered when driving SPMs at high scanning frequencies. The fast probe motion control and signal acquisition are implemented in a way that is totally transparent to the existing control electronics, allowing the user to switch immediately and seamlessly to the fast scanning mode when imaging in the conventional slow mode. The unit provides a completely non-invasive, fast scanning upgrade to common SPM instruments that are not specifically designed for high speed scanning. To test its performance, we used this module to drive a commercial scanning tunneling microscope (STM) system in a quasi-constant height mode to frame rates of 100 Hz and above, demonstrating extremely stable and high resolution imaging capabilities. The module is extremely versatile and its application is not limited to STM setups but can, in principle, be generalized to any scanning probe instrument.

  9. Generation of a high-brightness pulsed positron beam for the Munich scanning positron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Piochacz, Christian

    2009-11-20

    Within the present work the prerequisites for the operation of the Munich scanning positron microscope (SPM) at the high intense neutron induced positron source Munich (NEPOMUC) were established. This was accomplished in two steps: Firstly, a re-moderation device was installed at the positron beam facility NEPOMUC, which enhances the brightness of the positron beam for all connected experiments. The second step was the design, set up and initial operation of the SPM interface for the high efficient conversion of the continuous beam into a bunched beam. The in-pile positron source NEPOMUC creates a positron beam with a diameter of typically 7 mm, a kinetic energy of 1 keV and an energy spread of 50 eV. The NEPOMUC re-moderator generates from this beam a low energy positron beam (20 - 200 eV) with a diameter of less than 2 mm and an energy spread well below 2.5 eV. This was achieved with an excellent total efficiency of 6.55{+-}0.25 %. The re-moderator was not only the rst step to implement the SPM at NEPOMUc, it enables also the operation of the pulsed low energy positron beam system (PLEPS). Within the present work, at this spectrometer rst positron lifetime measurements were performed, which revealed the defect types of an ion irradiated uranium molybdenum alloy. Moreover, the instruments which were already connected to the positron beam facility bene ts considerably of the high brightness enhancement. In the new SPM interface an additional re-moderation stage enhances the brightness of the beam even more and will enable positron lifetime measurements at the SPM with a lateral resolution below 1 {mu}m. The efficiency of the re-moderation process in this second stage was 24.5{+-}4.5 %. In order to convert high efficiently the continuous positron beam into a pulsed beam with a repetition rate of 50 MHz and a pulse duration of less than 50 ps, a sub-harmonic pre-bucher was combined with two sine wave bunchers. Furthermore, the additional re-moderation stage of the

  10. A portable confocal hyperspectral microscope without any scan or tube lens and its application in fluorescence and Raman spectral imaging

    Science.gov (United States)

    Li, Jingwei; Cai, Fuhong; Dong, Yongjiang; Zhu, Zhenfeng; Sun, Xianhe; Zhang, Hequn; He, Sailing

    2017-06-01

    In this study, a portable confocal hyperspectral microscope is developed. In traditional confocal laser scanning microscopes, scan lens and tube lens are utilized to achieve a conjugate relationship between the galvanometer and the back focal plane of the objective, in order to achieve a better resolution. However, these lenses make it difficult to scale down the volume of the system. In our portable confocal hyperspectral microscope (PCHM), the objective is placed directly next to the galvomirror. Thus, scan lens and tube lens are not included in our system and the size of this system is greatly reduced. Furthermore, the resolution is also acceptable in many biomedical and food-safety applications. Through reducing the optical length of the system, the signal detection efficiency is enhanced. This is conducive to realizing both the fluorescence and Raman hyperspectral imaging. With a multimode fiber as a pinhole, an improved image contrast is also achieved. Fluorescent spectral images for HeLa cells/fingers and Raman spectral images of kumquat pericarp are present. The spectral resolution and spatial resolutions are about 0.4 nm and 2.19 μm, respectively. These results demonstrate that this portable hyperspectral microscope can be used in in-vivo fluorescence imaging and in situ Raman spectral imaging.

  11. Neonatal lines in the enamel of primary teeth--a morphological and scanning electron microscopic investigation.

    Science.gov (United States)

    Sabel, Nina; Johansson, Carina; Kühnisch, Jan; Robertson, Agneta; Steiniger, Frank; Norén, Jörgen G; Klingberg, Gunilla; Nietzsche, Sandor

    2008-10-01

    The neonatal line (NNL) is in principle found in all primary teeth and the line represents the time of birth. Earlier findings of the appearance of the NNL in light microscope and in microradiographs have shown not only changes in the prism direction of the enamel, but that the NNL has a hypomineralized character. The neonatal line was analyzed in un-decalcified sections of primary lower and central incisors, collected from individuals of different ages utilizing polarized light microscopy, microradiography, scanning electron microscopy (SEM) and X-ray analysis (XRMA). In polarized light the NNL appeared to have a more porous structure than the enamel in general. The appearance of the NNL as a dark line in microradiographs is interpreted as the NNL being less mineralized than neighbouring enamel. Analysis with ImageJ visualized the reduction of the amount of grey value, indicating that the NNL is less mineralized. Analysis of the NNL in SEM showed a reduction of the diameter of enamel prisms, the more narrow diameters continued through the postnatal enamel. A change of the growth direction of the prisms was also observed at the NNL. In a three-dimensional image the NNL appeared as a grove, however, in non-etched enamel no grove was seen. The elemental analyses with XRMA showed no marked changes in the content of C, Ca, P, N, O or S in the area around the NNL. The NNL is an optical phenomenon due to alterations in height, and degree of mineralization of the enamel prisms.

  12. Chlorhexidine as a root canal irrigant: Antimicrobial and scanning electron microscopic evaluation

    Directory of Open Access Journals (Sweden)

    Živković Slavoljub

    2010-01-01

    Full Text Available Introduction. Selection of irrigant is very important for longterm success of root canal therapy. Objective. This study was undertaken to evaluate the antimicrobial effects of 2% chlorhexidine digluconate solution (CHX against five selected microorganisms and to evaluate its efficacy in root canal cleaning. Methods. In this study, by agar diffusion test, were evaluated antimicrobial effects of three root canal irrigants: 5.25% NaOCl, 2.5% NaOCl and 2% CHX. The microorganisms tested in this study were Staphylococcus aureus, Streptococcus mutans, Enterococcus faecalis, Escherichia coli and Candida albicans. A scanning electron microscope was used to evaluate root canal cleaning ability of 5.25% NaOCl, 2.5% NaOCl, 2% CHX and 15% EDTA. Twelve extracted single-root human teeth were divided into four groups depending on the irrigant used during instrumentation. Mechanical preparation was performed with Step back technique and K files. Data were analyzed statistically by Student’s t-test. Results 5.25% NaOCl was the most effective against all tested microorganisms. 2.5% NaOCl and 2% CHX showed antimicrobial effects against all tested microorganisms but zones of inhibition were smaller. The best results in root canal walls cleaning were obtained in the group where the irrigant was 15% EDTA (score 2.33. In 5.25% NaOCl, 2.5% NaOCl and 2% CHX groups, there was more smear layer (score 4 and 5. Conclusion. 2% chlorhexidine digluconate showed strong antimicrobial effect on the tested microorganisms, but was not effective in cleaning root canal walls.

  13. Elevated temperature, nano-mechanical testing in situ in the scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wheeler, J. M.; Michler, J. [EMPA - Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructures, Feuerwerkerstrasse 39, Thun CH-3602 (Switzerland)

    2013-04-15

    A general nano-mechanical test platform capable of performing variable temperature and variable strain rate testing in situ in the scanning electron microscope is described. A variety of test geometries are possible in combination with focused ion beam machining or other fabrication techniques: indentation, micro-compression, cantilever bending, and scratch testing. The system is intrinsically displacement-controlled, which allows it to function directly as a micro-scale thermomechanical test frame. Stable, elevated temperature indentation/micro-compression requires the indenter tip and the sample to be in thermal equilibrium to prevent thermal displacement drift due to thermal expansion. This is achieved through independent heating and temperature monitoring of both the indenter tip and sample. Furthermore, the apex temperature of the indenter tip is calibrated, which allows it to act as a referenced surface temperature probe during contact. A full description of the system is provided, and the effects of indenter geometry and of radiation on imaging conditions are discussed. The stabilization time and temperature distribution throughout the system as a function of temperature is characterized. The advantages of temperature monitoring and thermal calibration of the indenter tip are illustrated, which include the possibility of local thermal conductivity measurement. Finally, validation results using nanoindentation on fused silica and micro-compression of <100> silicon micro-pillars as a function of temperature up to 500 Degree-Sign C are presented, and procedures and considerations taken for these measurements are discussed. A brittle to ductile transition from fracture to splitting then plastic deformation is directly observed in the SEM for silicon as a function of temperature.

  14. Charge compensation by in-situ heating for insulating ceramics in scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Li [Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124 (China); Ji, Yuan, E-mail: jiyuan@bjut.edu.cn [Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124 (China); Wei, Bin; Zhang, Yinqi; Fu, Jingyong; Xu, Xuedong; Han, Xiaodong [Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing 100124 (China)

    2009-10-15

    With a steady temperature increase under high vacuum (HV) in an environmental scanning electronic microscope, we observed charge-free characterization and fine secondary electron (SE) images in focus for insulating ceramics (alumina (Al{sub 2}O{sub 3}), aluminum nitride (AlN), pure magnesium silicate (Mg{sub 2}SiO{sub 4})). The sample current I{sub sc} increased from -8.18x10{sup -13} to 2.76x10{sup -7} A for Al{sub 2}O{sub 3} and -9.28x10{sup -12} to 2.77x10{sup -6} A for AlN with the temperature increased from 298 to 633 K. The surface conductance {sigma} increased from 5.6x10{sup -13} to 5.0x10{sup -11}/{Omega} for Al{sub 2}O{sub 3} and 1.1x10{sup -12} to 1.0x10{sup -7}/{Omega} for AlN with the temperature increased from 363 to 593 K. The SE image contrast obtained via heating approach in high vacuum with an Everhart-Thornley SE-detector was better than that via conventional approach of electron-ion neutralization in low vacuum (LV) with a gaseous SE-detector. The differences of compensation temperatures for charge effects indicate dielectric and thermal properties, and band structures of insulators. The charge compensation mechanisms of heating approach mainly relate to accelerated release of trapped electrons on insulating surface and to increase of electron emission yield by heating.

  15. The Atmospheric Scanning Electron Microscope with open sample space observes dynamic phenomena in liquid or gas

    Energy Technology Data Exchange (ETDEWEB)

    Suga, Mitsuo, E-mail: msuga@jeol.co.jp [Clair Project, JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Nishiyama, Hidetoshi; Konyuba, Yuji [Clair Project, JEOL Ltd., 3-1-2, Musashino, Akishima, Tokyo 196-8558 (Japan); Iwamatsu, Shinnosuke; Watanabe, Yoshiyuki [Yamagata Research Institute of Technology, 2-2-1, Matsuei, Yamagata, 990-2473 (Japan); Yoshiura, Chie; Ueda, Takumi [Graduate School of Pharmaceutical Sciences, The University of Tokyo, Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan); Sato, Chikara, E-mail: ti-sato@aist.go.jp [Biomedical Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-4, Umezono, Tsukuba 305-8568 (Japan)

    2011-12-15

    Although conventional electron microscopy (EM) requires samples to be in vacuum, most chemical and physical reactions occur in liquid or gas. The Atmospheric Scanning Electron Microscope (ASEM) can observe dynamic phenomena in liquid or gas under atmospheric pressure in real time. An electron-permeable window made of pressure-resistant 100 nm-thick silicon nitride (SiN) film, set into the bottom of the open ASEM sample dish, allows an electron beam to be projected from underneath the sample. A detector positioned below captures backscattered electrons. Using the ASEM, we observed the radiation-induced self-organization process of particles, as well as phenomena accompanying volume change, including evaporation-induced crystallization. Using the electrochemical ASEM dish, we observed tree-like electrochemical depositions on the cathode. In silver nitrate solution, we observed silver depositions near the cathode forming incidental internal voids. The heated ASEM dish allowed observation of patterns of contrast in melting and solidifying solder. Finally, to demonstrate its applicability for monitoring and control of industrial processes, silver paste and solder paste were examined at high throughput. High resolution, imaging speed, flexibility, adaptability, and ease of use facilitate the observation of previously difficult-to-image phenomena, and make the ASEM applicable to various fields. -- Highlights: Black-Right-Pointing-Pointer Atmospheric SEM (ASEM) observes dynamic phenomena in liquid or gas in open ASEM dish. Black-Right-Pointing-Pointer Random motion and radiation-induced self-organization were observed. Black-Right-Pointing-Pointer Tree-like electrochemical deposition of gold was observed on an electrode in situ. Black-Right-Pointing-Pointer Temperature-dependent phase transitions of solder were dynamically observed in air. Black-Right-Pointing-Pointer Silver and solder pastes were easily and rapidly observed in air for process control.

  16. Scanning electron microscope technique for measuring electrical conductivity: application to tetrathiafulvalene--tetracyanoquinodimethane

    Energy Technology Data Exchange (ETDEWEB)

    Long, James Peter [Univ. of Illinois, Urbana-Champaign, IL (United States)

    1977-01-01

    A new technique for measuring the electrical conductivity of small samples and its application to the organic conductor tetrathiafulvalene-tetracyanoquinodimethane (TTF-TCNQ) is reported. A movable current source provided by the electron beam of a scanning electron microscope is used to map out the potential distribution on crystal faces containing the a-b crystallographic axes. Silver paint contacts are used to return the beam current to ground and measure voltage changes as the beam position is moved. The results of the new technique are confirmed and complemented by the conventional movable contact method and the extension of both methods to low temperature is discussed. The potential distributions for our samples reveal frequently occurring irregularities in current flow which are attributable to sample imperfections and inhomogeneities in the silver paint contacts. Methods are presented whereby the commonly reported conductivities sigmaa and sigmab can be determined despite the presence of certain current flow irrgularities; room temperature values are found to be: sigmab = 490 ± 80 (Ωcm)-1 and sigmaa = 1.21 ± 0.15 (Ωcm)-1. The relationship of sigmaa/ and sigmab to the elements of the correctly expressed conductivity tensor for TTF-TCNQ is clarified. The influence of contact inhomogeneities on four-probe measurements of the temperature dependence of the b-axis conductivity as determined with an electrolytic tank model are also presented. It is found that there is a large probability of slightly underestimating conductivity, but that it is possible in a small number of cases to greatly overestimate conductivity.

  17. A simple but precise method for quantitative measurement of the quality of the laser focus in a scanning optical microscope.

    Science.gov (United States)

    Trägårdh, J; Macrae, K; Travis, C; Amor, R; Norris, G; Wilson, S H; Oppo, G-L; McConnell, G

    2015-07-01

    We report a method for characterizing the focussing laser beam exiting the objective in a laser scanning microscope. This method provides the size of the optical focus, the divergence of the beam, the ellipticity and the astigmatism. We use a microscopic-scale knife edge in the form of a simple transmission electron microscopy grid attached to a glass microscope slide, and a light-collecting optical fibre and photodiode underneath the specimen. By scanning the laser spot from a reflective to a transmitting part of the grid, a beam profile in the form of an error function can be obtained and by repeating this with the knife edge at different axial positions relative to the beam waist, the divergence and astigmatism of the postobjective laser beam can be obtained. The measured divergence can be used to quantify how much of the full numerical aperture of the lens is used in practice. We present data of the beam radius, beam divergence, ellipticity and astigmatism obtained with low (0.15, 0.7) and high (1.3) numerical aperture lenses and lasers commonly used in confocal and multiphoton laser scanning microscopy. Our knife-edge method has several advantages over alternative knife-edge methods used in microscopy including that the knife edge is easy to prepare, that the beam can be characterized also directly under a cover slip, as necessary to reduce spherical aberrations for objectives designed to be used with a cover slip, and it is suitable for use with commercial laser scanning microscopes where access to the laser beam can be limited. © 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.

  18. Time-resolved ultraviolet near-field scanning optical microscope for characterizing photoluminescence lifetime of light-emitting devices.

    Science.gov (United States)

    Park, Kyoung-Duck; Jeong, Hyun; Kim, Yong Hwan; Yim, Sang-Youp; Lee, Hong Seok; Suh, Eun-Kyung; Jeong, Mun Seok

    2013-03-01

    We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.

  19. Atomic force microscopy and scanning electron microscopy analysis of daily disposable limbal ring contact lenses.

    Science.gov (United States)

    Lorenz, Kathrine Osborn; Kakkassery, Joseph; Boree, Danielle; Pinto, David

    2014-09-01

    Limbal ring (also known as 'circle') contact lenses are becoming increasingly popular, especially in Asian markets because of their eye-enhancing effects. The pigment particles that give the eye-enhancing effects of these lenses can be found on the front or back surface of the contact lens or 'enclosed' within the lens matrix. The purpose of this research was to evaluate the pigment location and surface roughness of seven types of 'circle' contact lenses. Scanning electron microscopic (SEM) analysis was performed using a variable pressure Hitachi S3400N instrument to discern the placement of lens pigments. Atomic force microscopy (Dimension Icon AFM from Bruker Nano) was used to determine the surface roughness of the pigmented regions of the contact lenses. Atomic force microscopic analysis was performed in fluid phase under contact mode using a Sharp Nitride Lever probe (SNL-10) with a spring constant of 0.06 N/m. Root mean square (RMS) roughness values were analysed using a generalised linear mixed model with a log-normal distribution. Least square means and their corresponding 95% confidence intervals were estimated for each brand, location and pigment combination. SEM cross-sectional images at 500× and 2,000× magnification showed pigment on the surface of six of the seven lens types tested. The mean depth of pigment for 1-DAY ACUVUE DEFINE (1DAD) lenses was 8.1 μm below the surface of the lens, while the remaining lens types tested had pigment particles on the front or back surface. Results of the atomic force microscopic analysis indicated that 1DAD lenses had significantly lower root mean square roughness values in the pigmented area of the lens than the other lens types tested. SEM and AFM analysis revealed pigment on the surface of the lens for all types tested with the exception of 1DAD. Further research is required to determine if the difference in pigment location influences on-eye performance. © 2014 The Authors. Clinical and Experimental

  20. Construction of a four tip scanning tunneling microscope/scanning electron microscope combination and conductivity measurements of silicide nanowires; Aufbau einer Vierspitzen-Rastertunnelmikroskop/Rasterelektronenmikroskop-Kombination und Leitfaehigkeitsmessungen an Silizid Nanodraehten

    Energy Technology Data Exchange (ETDEWEB)

    Zubkov, Evgeniy

    2013-09-01

    In this work the combination of a four-tip scanning tunneling microscope with a scanning electron microscope is presented. By means of this apparatus it is possible to perform the conductivity measurements on the in-situ prepared nanostructures in ultra-high vacuum. With the aid of a scanning electron microscope (SEM), it becomes possible to position the tunneling tips of the four-tip scanning tunneling microscope (STM), so that an arrangement for a four-point probe measurement on nanostructures can be obtained. The STM head was built according to the novel coaxial Beetle concept. This concept allows on the one hand, a very compact arrangement of the components of the STM and on the other hand, the new-built STM head has a good mechanical stability, in order to achieve atomic resolution with all four STM units. The atomic resolution of the STM units was confirmed by scanning a Si(111)-7 x 7 surface. The thermal drift during the STM operation, as well as the resonant frequencies of the mechanical structure of the STM head, were determined. The scanning electron microscope allows the precise and safe navigation of the tunneling tips on the sample surface. Multi tip spectroscopy with up to four STM units can be performed synchronously. To demonstrate the capabilities of the new-built apparatus the conductivity measurements were carried out on metallic yttrium silicide nanowires. The nanowires were prepared by the in-situ deposition of yttrium on a heated Si(110) sample surface. Current-voltage curves were recorded on the nanowires and on the wetting layer in-between. The curves indicate an existence of the Schottky barrier between the yttrium silicide nanowires and the silicon bulk. By means of the two-tip measurements with a gate, the insulating property of the Schottky barrier has been confirmed. Using this Schottky barrier, it is possible to limit the current to the nanowire and to prevent it from flowing through the silicon bulk. A four-tip resistance measurement

  1. Scanning probe microscope visualization of t-loop assembly by TRF2 in cells

    Science.gov (United States)

    Cao, En-Hua; Guo, Xiao-Fe; Wang, Ju-Jun; Qin, Jing-Fen

    2005-02-01

    Telomeres are essential nucleoprotein structure at the ends of all eukaryotic chromosomes. Our previous work demonstrated that mammalian telomeres were shown to end in a large t-loop structure in vitro and the formation of t-loops was dependent on the presence of TRF2. In this work, the telomere DNA and its complex of TRF2 in HeLa cells has been direct observed in the nanometer resolution regime by atomic force microscopy (AFM) and scanning near-field optical microscopy (SNOM). AFM images showed that the looped structures exited in cell extract containing TRF2, but it disappeared in the protein-deleted samples. When cells were pretreated by UV light plus psoralen, the looped structure could be observed in the protein-deleted samples. SNOM images further demonstrated TRF2 and p53 proteins in cell was bound at the loop junction. Above results suggest that the telomere t-loop structure by TRF2 play a important role in cell-senescence, and might signals p53 protein directly through association with the t-loop junction in cells.

  2. A rapid method for combined laser scanning confocal microscopic and electron microscopic visualization of biocytin or neurobiotin-labeled neurons.

    Science.gov (United States)

    Sun, X J; Tolbert, L P; Hildebrand, J G; Meinertzhagen, I A

    1998-02-01

    Intracellular recording and dye filling are widely used to correlate the morphology of a neuron with its physiology. With laser scanning confocal microscopy, the complex shapes of labeled neurons in three dimensions can be reconstructed rapidly, but this requires fluorescent dyes. These dyes are neither permanent nor electron dense and therefore do not allow investigation by electron microscopy. Here we report a technique that quickly and easily converts a fluorescent label into a more stable and electron-dense stain. With this technique, a neuron is filled with Neurobiotin or biocytin, reacted with fluorophore-conjugated avidin, and imaged by confocal microscopy. To permit long-term storage or EM study, the fluorescent label is then converted to a stable electron-dense material by a single-step conversion using a commercially available ABC kit. We find that the method, which apparently relies on recognition of avidin's excess biotin binding sites by the biotin-peroxidase conjugate, is both faster and less labor intensive than photo-oxidation procedures in common use. The technique is readily adaptable to immunocytochemistry with biotinylated probes, as we demonstrate using anti-serotonin as an example.

  3. A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Qi; Wang, Junting; Lu, Qingyou, E-mail: qxl@ustc.edu.cn [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China); Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China); Hou, Yubin [High Magnetic Field Laboratory, Chinese Academy of Sciences and University of Science and Technology of China, Hefei, Anhui 230026 (China)

    2013-11-15

    We present a novel homebuilt scanning tunneling microscope (STM) with high quality atomic resolution. It is equipped with a small but powerful GeckoDrive piezoelectric motor which drives a miniature and detachable scanning part to implement coarse approach. The scanning part is a tiny piezoelectric tube scanner (industry type: PZT-8, whose d{sub 31} coefficient is one of the lowest) housed in a slightly bigger polished sapphire tube, which is riding on and spring clamped against the knife edges of a tungsten slot. The STM so constructed shows low back-lashing and drifting and high repeatability and immunity to external vibrations. These are confirmed by its low imaging voltages, low distortions in the spiral scanned images, and high atomic resolution quality even when the STM is placed on the ground of the fifth floor without any external or internal vibration isolation devices.

  4. A high-stability scanning tunneling microscope achieved by an isolated tiny scanner with low voltage imaging capability

    Science.gov (United States)

    Wang, Qi; Hou, Yubin; Wang, Junting; Lu, Qingyou

    2013-11-01

    We present a novel homebuilt scanning tunneling microscope (STM) with high quality atomic resolution. It is equipped with a small but powerful GeckoDrive piezoelectric motor which drives a miniature and detachable scanning part to implement coarse approach. The scanning part is a tiny piezoelectric tube scanner (industry type: PZT-8, whose d31 coefficient is one of the lowest) housed in a slightly bigger polished sapphire tube, which is riding on and spring clamped against the knife edges of a tungsten slot. The STM so constructed shows low back-lashing and drifting and high repeatability and immunity to external vibrations. These are confirmed by its low imaging voltages, low distortions in the spiral scanned images, and high atomic resolution quality even when the STM is placed on the ground of the fifth floor without any external or internal vibration isolation devices.

  5. Standing-wave-excited multiplanar fluorescence in a laser scanning microscope reveals 3D information on red blood cells

    CERN Document Server

    Amor, Rumelo; Amos, William Bradshaw; McConnell, Gail

    2014-01-01

    Standing-wave excitation of fluorescence is highly desirable in optical microscopy because it improves the axial resolution. We demonstrate here that multiplanar excitation of fluorescence by a standing wave can be produced in a single-spot laser scanning microscope by placing a plane reflector close to the specimen. We report that the relative intensities in each plane of excitation depend on the Stokes shift of the fluorochrome. We show by the use of dyes specific for the cell membrane how standing-wave excitation can be exploited to generate precise contour maps of the surface membrane of red blood cells, with an axial resolution of ~90 nm. The method, which requires only the addition of a plane mirror to an existing confocal laser scanning microscope, may well prove useful in studying diseases which involve the red cell membrane, such as malaria.

  6. Ultrastructural study of polyspermy during early embryo development in pigs, observed by scanning electron microscope and transmission electron microscope.

    Science.gov (United States)

    Xia, P; Wang, Z; Yang, Z; Tan, J; Qin, P

    2001-02-01

    Polyspermy is generally considered a pathological phenomenon in mammals. Incidence of polyspermy in porcine eggs in vivo is extremely high (30-40%) compared with other species, and polyspermy rate in the in vitro fertilized eggs in pigs can reach 65%. It is still unknown whether polyspermy to a certain degree is a physiological condition in pigs, and whether porcine eggs have any capability with which to remove the accessory sperm in the cytoplasm. The objectives in the present study are to observe the ultrastructural changes of accessory sperm during early embryonic development in pigs. A total of 58 normal, early embryos at one-, two, three-, and four-cell and morular stages were collected from gilts and were studied by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The surface ultrastructure showed that sperm fusion with the zona pellucida was a continuous process during one-, two-, three-, and four-cell and morular stages, as observed by the SEM. Accessory sperm were present in the cytoplasm of cleaved embryos. The sperm heads in the cytoplasm of cleaved embryos did not decondense. TEM revealed the presence of a condensed sperm head within a lysosome (or phagolysosome) in a three-cell embryo. These observations suggest that polyspermy may be a physiological condition in pigs and that early embryos may develop to term if accessory sperm do not interrupt the embryo genome. Furthermore, lysosome activity could be another physiological mechanism for removing accessory sperm in the cytoplasm of fertilized eggs and cleaved embryos after fertilization in pigs.

  7. Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Wang, P; Behan, G; Kirkland, A I; Nellist, P D, E-mail: peng.wang@materials.ox.ac.u [Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH (United Kingdom)

    2010-07-01

    Scanning confocal electron microscopy (SCEM) is a new imaging mode in electron microscopy. Spherical aberration corrected electron microscope instruments fitted with two aberration correctors can be used in this mode which provides improved depth resolution and selectivity compared to optical sectioning in a conventional scanning transmission geometry. In this article, we consider a confocal optical configuration for SCEM using inelastically scattered electrons. We lay out the necessary steps for achieving this new operational mode in a double aberration-corrected instrument with uncorrected chromatic aberration and present preliminary experimental results in such mode.

  8. Development of a single cell electroporation method using a scanning ion conductance microscope with a theta nanopipette

    Science.gov (United States)

    Sakurai, Satoshi; Yamazaki, Koji; Ushiki, Tatsuo; Iwata, Futoshi

    2015-08-01

    We developed a novel electroporation method using a scanning ion conductance microscope (SICM) with a theta capillary nanopipette probe that has two apertures at the edge of the pipette. One aperture of the pipette probe was used to control the pipette-surface distance and to apply pulse voltage for electroporation. The other was used to eject material over the cell by local electrophoresis. Using the nanopipette, propidium iodide was successfully introduced into a targeted single Hela cell without influencing the surrounding cells. Furthermore, by scanning the theta nanopipette probe using the SICM, the morphological behaviors of the electroporated cells could be observed.

  9. Micro-four-point probes in a UHV scanning electron microscope for in-situ surface-conductivity measurements

    DEFF Research Database (Denmark)

    Shiraki, I.; Nagao, T.; Hasegawa, S.

    2000-01-01

    For in-situ measurements of surface conductivity in ultrahigh vacuum (UHV), we have installed micro-four-point probes (probe spacings down to 4 mum) in a UHV scanning electron microscope (SEM) combined with scanning reflection-high-energy electron diffraction (RHEED). With the aid of piezoactuators...... for precise positioning of the probes, local conductivity of selected surface domains of well-defined superstructures could be measured during SEM and RHEED observations. It was found that the surface sensitivity of the conductivity measurements was enhanced by reducing the probe spacing, enabling...

  10. A Scanning Tunneling Microscope at the Milli-Kelvin, High Magnetic Field Frontier

    Science.gov (United States)

    Zhou, Brian B.

    The ability to access lower temperatures and higher magnetic fields has precipitated breakthroughs in our understanding of physical matter, revealing novel effects such as superconductivity, the integer and fractional quantum Hall effects, and single spin magnetism. Extending the scanning tunneling microscope (STM) to the extremity of the B-T phase space provides unique insight on these phenomena both at the atomic level and with spectroscopic power. In this thesis, I describe the design and operation of a full-featured, dilution refrigerator-based STM capable of sample preparation in ultra-high vacuum (UHV) and spectroscopic mapping with an electronic temperature of 240 mK in fields up to 14 T. I detail technical solutions to overcome the stringent requirements on vibration isolation, electronic noise, and mechanical design necessary to successfully integrate the triad of the STM, UHV, and dilution refrigeration. Measurements of the heavy fermion superconductor CeCoIn5 ( Tc = 2.3 K) directly leverage the resulting combination of ultra-low temperature and atomic resolution to identify its Cooper pairing to be of dx2-y2 symmetry. Spectroscopic and quasiparticle interference measurements isolate a Kondo-hybridized, heavy effective mass band near the Fermi level, from which nodal superconductivity emerges in CeCoIn5 in coexistence with an independent pseudogap. Secondly, the versatility of this instrument is demonstrated through measurements of the three-dimensional Dirac semimetal Cd3As2 up to the maximum magnetic field. Through high resolution Landau level spectroscopy, the dispersion of the conduction band is shown to be Dirac-like over an unexpectedly extended regime, and its two-fold degeneracy to be lifted in field through a combination of orbital and Zeeman effects. Indeed, these two experiments on CeCoIn5 and Cd3 As2 glimpse the new era of nano-scale materials research, spanning superconductivity, topological properties, and single spin phenomena, made

  11. Clinical and scanning electron microscopic assessments of porcelain and ceromer resin veneers.

    Science.gov (United States)

    Dhawan, Pankaj; Prakash, Hari; Shah, Nassem

    2003-01-01

    Recently available Ceromer resin materials are promising for fabrication of esthetic anterior laminates and provices an alternative, cost effective treament modality to porcelain laminates for discolored anterior anterior teeth. It was proposed to study the esthetic quality and surface finish of veneers fbricated from ceromer resin and compare it with the standard porcelain veneers, both clinically as well as by scanning electron microscope (SEM) at baseline and at 12 months. If found comparable, ceromer resin veneer could provide an alternative to porcelain veneers which is an expensive technique for a developing country like India. Seventy-two veneers, 36 porcelain and 36 ceromer were placed in 12 subjects who were studied at 0, 6 and 12 months for clinical acceptability, and at 0 and 12 months for SEM assessment. The restorations were luted with Opal luting composite and Scotchbond multipurpose system; polyvinyl siloxane was used as the impression material. The clinical assessment was made using modified United Public Health Services criteria, whereas the SEM assessment was made by quantitative analysis of the marginal fit and surface characteristics of the two veneering materials. Ceromer exhibited good anatomical form during the study period, but depicted changes in color, surface appearance, marginal adaptation, increased marginal discoloration, and tissue response. Inability to achieve a good finish with high gloss was a major drawback of the ceromer. Porcelain exhibited better esthetics, marginal adaptation, finish qualities, and tissue response. The SEM showed good to excellent marginal fit at baselinne in ceromer and porcelain veneers, but loss of luting resin at the margins was evident in both the materials after 12 months, leading to visible gaps in a number of veneer restorations. Ceromer veneers exhibited poor surface characteristics in several restorations, which further degraded in an oral conditions over 12 months. Veneering is an effective mode of

  12. Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope

    OpenAIRE

    Kriaa, H.; Guitton, A.; Maloufi, N.

    2017-01-01

    Nowadays Field Emission Gun-Scanning Electron Microscopes provide detailed crystallographic information with high spatial and angular resolutions, and allow direct observation of crystalline defects, such as dislocations, through an attractive technique called Electron Channeling Contrast Imaging (ECCI). Dislocations play a crucial role in the properties of materials and ECCI has naturally emerged as an adapted tool for characterizing defects in bulk specimen. Nevertheless, fine control of th...

  13. Scanning electron microscopic (Sem studies on fourth instar larva and pupa of Anopheles (Cellia stephensi Liston (Anophelinae: Culicidae

    Directory of Open Access Journals (Sweden)

    Jagbir Singh Kirti

    2014-12-01

    Full Text Available Anopheles (Cellia stephensi Liston is a major vector species of malaria in Indian subcontinent. Taxonomists have worked on its various morphological aspects and immature stages to explore additional and new taxonomic attributes. Scanning electron microscopic (SEM studies have been conducted on the fourth instar larva and pupa of An. stephensi to find additional taxonomic features for the first time from Punjab state.

  14. Fabrication of narrow surface relief features in a side-chain azobenzene polyester with a scanning near-field microscope

    DEFF Research Database (Denmark)

    Ramanujam, P.S.; Holme, N. C. R.; Pedersen, M.

    2001-01-01

    We show that it is possible to fabricate topographic submicron features in a side-chain azobenzene polyester with a scanning near-field optical microscope, Through irradiation at a wavelength of 488 run at intensity levels of 12 W/cm(2), topographic features as narrow as 240 nm and as high as 6 nm...... in high-density optical storage and high-resolution lithography....

  15. Modeling a Miniaturized Scanning Electron Microscope Focusing Column - Lessons Learned in Electron Optics Simulation

    Science.gov (United States)

    Loyd, Jody; Gregory, Don; Gaskin, Jessica

    2016-01-01

    This presentation discusses work done to assess the design of a focusing column in a miniaturized Scanning Electron Microscope (SEM) developed at the NASA Marshall Space Flight Center (MSFC) for use in-situ on the Moon-in particular for mineralogical analysis. The MSFC beam column design uses purely electrostatic fields for focusing, because of the severe constraints on mass and electrical power consumption imposed by the goals of lunar exploration and of spaceflight in general. The resolution of an SEM ultimately depends on the size of the focused spot of the scanning beam probe, for which the stated goal here is a diameter of 10 nanometers. Optical aberrations are the main challenge to this performance goal, because they blur the ideal geometrical optical image of the electron source, effectively widening the ideal spot size of the beam probe. In the present work the optical aberrations of the mini SEM focusing column were assessed using direct tracing of non-paraxial rays, as opposed to mathematical estimates of aberrations based on paraxial ray-traces. The geometrical ray-tracing employed here is completely analogous to ray-tracing as conventionally understood in the realm of photon optics, with the major difference being that in electron optics the lens is simply a smoothly varying electric field in vacuum, formed by precisely machined electrodes. Ray-tracing in this context, therefore, relies upon a model of the electrostatic field inside the focusing column to provide the mathematical description of the "lens" being traced. This work relied fundamentally on the boundary element method (BEM) for this electric field model. In carrying out this research the authors discovered that higher accuracy in the field model was essential if aberrations were to be reliably assessed using direct ray-tracing. This led to some work in testing alternative techniques for modeling the electrostatic field. Ultimately, the necessary accuracy was attained using a BEM

  16. Probing the interaction between air bubble and sphalerite mineral surface using atomic force microscope.

    Science.gov (United States)

    Xie, Lei; Shi, Chen; Wang, Jingyi; Huang, Jun; Lu, Qiuyi; Liu, Qingxia; Zeng, Hongbo

    2015-03-03

    The interaction between air bubbles and solid surfaces plays important roles in many engineering processes, such as mineral froth flotation. In this work, an atomic force microscope (AFM) bubble probe technique was employed, for the first time, to directly measure the interaction forces between an air bubble and sphalerite mineral surfaces of different hydrophobicity (i.e., sphalerite before/after conditioning treatment) under various hydrodynamic conditions. The direct force measurements demonstrate the critical role of the hydrodynamic force and surface forces in bubble-mineral interaction and attachment, which agree well with the theoretical calculations based on Reynolds lubrication theory and augmented Young-Laplace equation by including the effect of disjoining pressure. The hydrophobic disjoining pressure was found to be stronger for the bubble-water-conditioned sphalerite interaction with a larger hydrophobic decay length, which enables the bubble attachment on conditioned sphalerite at relatively higher bubble approaching velocities than that of unconditioned sphalerite. Increasing the salt concentration (i.e., NaCl, CaCl2) leads to weakened electrical double layer force and thereby facilitates the bubble-mineral attachment, which follows the classical Derjaguin-Landau-Verwey-Overbeek (DLVO) theory by including the effects of hydrophobic interaction. The results provide insights into the basic understanding of the interaction mechanism between bubbles and minerals at nanoscale in froth flotation processes, and the methodology on probing the interaction forces of air bubble and sphalerite surfaces in this work can be extended to many other mineral and particle systems.

  17. Surface features on Sahara soil dust particles made visible by atomic force microscope (AFM phase images

    Directory of Open Access Journals (Sweden)

    M. O. Andreae

    2008-10-01

    Full Text Available We show that atomic force microscopy (AFM phase images can reveal surface features of soil dust particles, which are not evident using other microscopic methods. The non-contact AFM method is able to resolve topographical structures in the nanometer range as well as to uncover repulsive atomic forces and attractive van der Waals' forces, and thus gives insight to surface properties. Though the method does not allow quantitative assignment in terms of chemical compound description, it clearly shows deposits of distinguishable material on the surface. We apply this technique to dust aerosol particles from the Sahara collected over the Atlantic Ocean and describe micro-features on the surfaces of such particles.

  18. Investigation of specific interactions between T7 promoter and T7 RNA polymerase by force spectroscopy using atomic force microscope.

    Science.gov (United States)

    Zhang, Xiaojuan; Yao, Zhixuan; Duan, Yanting; Zhang, Xiaomei; Shi, Jinsong; Xu, Zhenghong

    2018-01-11

    The specific recognition and binding of promoter and RNA polymerase is the first step of transcription initiation in bacteria and largely determines transcription activity. Therefore, direct analysis of the interaction between promoter and RNA polymerase in vitro may be a new strategy for promoter characterization, to avoid interference due to the cell's biophysical condition and other regulatory elements. In the present study, the specific interaction between T7 promoter and T7 RNA polymerase was studied as a model system using force spectroscopy based on atomic force microscope (AFM). The specific interaction between T7 promoter and T7 RNA polymerase was verified by control experiments, and the rupture force in this system was measured as 307.2 ± 6.7 pN. The binding between T7 promoter mutants with various promoter activities and T7 RNA polymerase was analyzed. Interaction information including rupture force, rupture distance and binding percentage were obtained in vitro , and reporter gene expression regulated by these promoters was also measured according to a traditional promoter activity characterization method in vivo Using correlation analysis, it was found that the promoter strength characterized by reporter gene expression was closely correlated with rupture force and the binding percentage by force spectroscopy. These results indicated that the analysis of the interaction between promoter and RNA polymerase using AFM-based force spectroscopy was an effective and valid approach for the quantitative characterization of promoters. © 2018 The Author(s). Published by Portland Press Limited on behalf of the Biochemical Society.

  19. Experimental Implementation of a Model-Based Inverse Filter to Attenuate Hysteresis in an Atomic Force Microscope

    National Research Council Canada - National Science Library

    Hatch, Andrew; Smith, Ralph G; De, Tathagata

    2004-01-01

    This paper addresses the development and experimental validation of a model-based, open loop control design for mitigating the frequency-dependent effects of hysteresis in an atomic force microscope (AFM...

  20. Comparison of macroscopic and microscopic (stereomicroscopy and scanning electron microscopy) features of bone lesions due to hatchet hacking trauma.

    Science.gov (United States)

    Nogueira, Luísa; Quatrehomme, Gérald; Bertrand, Marie-France; Rallon, Christophe; Ceinos, Romain; du Jardin, Philippe; Adalian, Pascal; Alunni, Véronique

    2017-03-01

    This experimental study examined the lesions produced by a hatchet on human bones (tibiae). A total of 30 lesions were produced and examined macroscopically (naked eye) and by stereomicroscopy. 13 of them were also analyzed using scanning electron microscopy. The general shape of the lesion, both edges, both walls, the kerf floor and the extremities were described. The length and maximum width of the lesions were also recorded. The microscopic analysis of the lesions led to the description of a sharp-blunt mechanism. Specific criteria were identified (lateral pushing back, fragmentation of the upraising, fossa dug laterally to the edge and vertical striae) enabling the forensic expert to conclude that a hacking instrument was used. These criteria are easily identifiable using scanning electron microscopy, but can also be observed with stereomicroscopy. Overall, lateral pushing back and vertical striae visible using stereomicroscopy and scanning electron microscopy signal the use of a hacking tool.

  1. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision.

    Science.gov (United States)

    Baumann, Fabian; Heucke, Stephan F; Pippig, Diana A; Gaub, Hermann E

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  2. Tip localization of an atomic force microscope in transmission microscopy with nanoscale precision

    Science.gov (United States)

    Baumann, Fabian; Heucke, Stephan F.; Pippig, Diana A.; Gaub, Hermann E.

    2015-03-01

    Since the atomic force microscope (AFM) has evolved into a general purpose platform for mechanical experiments at the nanoscale, the need for a simple and generally applicable localization of the AFM cantilever in the reference frame of an optical microscope has grown. Molecular manipulations like in single molecule cut and paste or force spectroscopy as well as tip mediated nanolithography are prominent examples for the broad variety of applications implemented to date. In contrast to the different kinds of superresolution microscopy where fluorescence is used to localize the emitter, we, here, employ the absorbance of the tip to localize its position in transmission microscopy. We show that in a low aperture illumination, the tip causes a significant reduction of the intensity in the image plane of the microscope objective when it is closer than a few hundred nm. By independently varying the z-position of the sample slide, we could verify that this diffraction limited image of the tip is not caused by a near field effect but is rather caused by the absorbance of the transmitted light in the low apex needle-like tip. We localized the centroid position of this tip image with a precision of better than 6 nm and used it in a feedback loop to position the tip into nano-apertures of 110 nm radius. Single-molecule force spectroscopy traces on the unfolding of individual green fluorescent proteins within the nano-apertures showed that their center positions were repeatedly approached with very high fidelity leaving the specific handle chemistry on the tip's surface unimpaired.

  3. Combining atomic force microscope and quartz crystal microbalance studies for cell detection

    Science.gov (United States)

    Hayden, Oliver; Bindeus, Roland; Dickert, Franz L.

    2003-11-01

    The adhesion of microorganisms on a patterned polyurethane surface was studied simultaneously online and in situ with a quartz crystal microbalance (QCM) and an atomic force microscope (AFM). The specific interaction between Saccharomyces cerevisiae cells and their fingerprints formed by molecular imprinting results in a typical Sauerbrey behaviour, when adhesion events are observable with an AFM. The sensor response due to adsorption of Gram positive Leuconostoc oenus, however, shows non-Sauerbrey behaviour. Bacteria, naturally being smaller than yeast cells, were 'invisible' to liquid phase AFM-measurements, which is due to a weaker surface interaction. Thus, AFM measurements give a hint for unusual frequency enhancements in QCM microorganism measurements.

  4. Reliable measurement of elastic modulus of cells by nanoindentation in an atomic force microscope

    KAUST Repository

    Zhou, Zhoulong

    2012-04-01

    The elastic modulus of an oral cancer cell line UM1 is investigated by nanoindentation in an atomic force microscope with a flat-ended tip. The commonly used Hertzian method gives apparent elastic modulus which increases with the loading rate, indicating strong effects of viscoelasticity. On the contrary, a rate-jump method developed for viscoelastic materials gives elastic modulus values which are independent of the rate-jump magnitude. The results show that the rate-jump method can be used as a standard protocol for measuring elastic stiffness of living cells, since the measured values are intrinsic properties of the cells. © 2011 Elsevier Ltd.

  5. 3D mechanical measurements with an atomic force microscope on 1D structures

    DEFF Research Database (Denmark)

    Kallesøe, Christian; Larsen, Martin Benjamin Barbour Spanget; Bøggild, Peter

    2012-01-01

    We have developed a simple method to characterize the mechanical properties of three dimensional nanostructures, such as nanorods standing up from a substrate. With an atomic force microscope the cantilever probe is used to deflect a horizontally aligned nanorod at different positions along...... the nanorod, using the apex of the cantilever itself rather than the tip normally used for probing surfaces. This enables accurate determination of nanostructures' spring constant. From these measurements, Young's modulus is found on many individual nanorods with different geometrical and material structures...... in a short time. Based on this method Young's modulus of carbon nanofibers and epitaxial grown III-V nanowires has been determined....

  6. Building a multi-walled carbon nanotube-based mass sensor with the atomic force microscope

    DEFF Research Database (Denmark)

    Mateiu, Ramona Valentina; Kuhle, A.; Marie, Rodolphe Charly Willy

    2005-01-01

    are used. The gold substrate is first covered with hydrophobic thiol molecules: octadecanthiol. The octadecanthiol molecules are then selectively removed from small areas by nanoshaving the gold substrate with the tip of an atomic force microscope (AFM) operating in contact mode. Hydrophilic thiols (2......We report an approach for building a mass sensor based on multi-walled carbon nanotubes (MWCNT). We propose a method with a great potential for the positioning of MWCNTs based on self-assembly onto patterned hydrophilic areas. For the experiments ultra flat mica substrates covered with gold...

  7. Surface topography characterization using an atomic force microscope mounted on a coordinate measuring machine

    DEFF Research Database (Denmark)

    De Chiffre, Leonardo; Hansen, H.N; Kofod, N

    1999-01-01

    The paper describes the construction, testing and use of an integrated system for topographic characterization of fine surfaces on parts having relatively big dimensions. An atomic force microscope (AFM) was mounted on a manual three-coordinate measuring machine (CMM) achieving free positioning...... of the AFM probe in space. This means that the limited measuring range of the AFM (40 mu m x 40 mu m x 2.7 um) can be extended by positioning the AFM probe using the movements of the CMM axes (400 mm x 100 mm x 75 mm). Evaluation of the background noise by determining the Sa value of an optical fiat gave...

  8. Multifractal spectra of atomic force microscope images of amorphous electroless Ni Cu P alloy

    Science.gov (United States)

    Yu, Hui-Sheng; Sun, Xia; Luo, Shou-Fu; Wang, Yong-Rui; Wu, Zi-Qin

    2002-05-01

    The surface topographies of Si/TiN/Pd substrate and amorphous electroless Ni-13.1 wt.% Cu-9.3 wt.% P alloy deposited for various times were measured by atomic force microscope (AFM). Multifractal spectra f( α) show that the longer the deposition time, the wider the spectrum, and the larger the Δ f (Δ f= f( αmin)- f( αmax)). It is apparent that the nonuniformity of the height distribution increases with the increasing deposition time, and the nodules of Ni-Cu-P alloy grow in both horizontal and vertical way. These results show that the AFM images can be characterized by the multifractal spectra.

  9. Track sensitivity and the surface roughness measurements of CR-39 with atomic force microscope

    CERN Document Server

    Yasuda, N; Amemiya, K; Takahashi, H; Kyan, A; Ogura, K

    1999-01-01

    Atomic Force Microscope (AFM) has been applied to evaluate the surface roughness and the track sensitivity of CR-39 track detector. We experimentally confirmed the inverse correlation between the track sensitivity and the roughness of the detector surface after etching. The surface of CR-39 (CR-39 doped with antioxidant (HARZLAS (TD-1)) and copolymer of CR-39/NIPAAm (TNF-1)) with high sensitivity becomes rough by the etching, while the pure CR-39 (BARYOTRAK) with low sensitivity keeps its original surface clarity even for the long etching.

  10. Graded morphogenetic patterns during the development of the extraembryonic blood system and coelom of the chick blastoderm: A scanning electron microscope and light microscope study.

    Science.gov (United States)

    Kessel, J; Fabian, B C

    1985-06-01

    This scanning electron- and light-microscopic study traces the morphogenesis of the yolk-sac vascular system and extraembryonic coelom in the chick blastoderm. The fate of the mesodermal cells in both the area opaca vasculosa (AOV) and the area pellucida (AP) is followed, and the cellular patterning in these two areas is compared. We describe new details of the formation of coelom lining in the AOV, and new observations of the tendency of the intravascular blood island cells of the AOV to become flattened and attenuated. The morphogenesis of the blood system and coelom is analyzed in terms of polarized morphological patterns with coordinates in two modes:proximodistal (from the AP to the AOV) and dorsoventral (from the ectoderm to the endoderm). By highlighting differences in the methods of formation of blood vessels and coelom lining in the AP and AOV, this paper resolves some paradoxes in the literature.

  11. Low Temperature Apertureless Near-field Scanning Optical Microscope for Optical Spectroscopy of Single Ge/Si Quantum Dots

    Science.gov (United States)

    Zhu, Henry; Patil, N. G.; Levy, Jeremy

    2001-03-01

    A low-temperature apertureless near-field scanning optical microscope has been designed and constructed for the purpose of investigating the optical properties of individual Ge/Si quantum dots. The microscope fits in the 37 mm bore of a Helium vapor magneto-optic cryostat, allowing operations down to liquid helium temperatures in magnetic fields up to 8 Tesla. An in situ microscope objective focuses light onto the sample, which is scanned in the three spatial directions using a compact modular stage. An AFM/STM tip resides on the top; feedback is achieved using a quartz tuning fork oscillator. Both tip and objective are attached to inertial sliding motors that can move in fine (10 nm) steps to achieve touchdown and focus. A femtosecond optical parametric oscillator is used to excite carriers in the quantum dots both resonantly and non-resonantly; scattered luminescence from the AFM/STM tip is collected and analyzed spectrally using a 1/2 meter imaging spectrometer and a LN_2-cooled InGaAs array. We gratefully acknowledge NSF (DMR-9701725, IMR-9802784) and DARPA (DAAD-16-99-C1036) for financial support of this work.

  12. Bottlenecks in bog pine multiplication by somatic embryogenesis and their visualization with the environmental scanning electron microscope.

    Science.gov (United States)

    Vlašínová, Helena; Neděla, Vilem; Đorđević, Biljana; Havel, Ladislav

    2017-07-01

    Somatic embryogenesis (SE) is an important biotechnological technique used for the propagation of many pine species in vitro. However, in bog pine, one of the most endangered tree species in the Czech Republic, limitations were observed, which negatively influenced the development and further germination of somatic embryos. Although initiation frequency was very low-0.95 %, all obtained cell lines were subjected to maturation. The best responding cell line (BC1) was used and subjected to six different variants of the maturation media. The media on which the highest number of early-precotyledonary/cotyledonary somatic embryos was formed was supplemented with 121 μM abscisic acid (ABA) and with 6 % maltose. In the end of maturation experiments, different abnormalities in formation of somatic embryos were observed. For visualization and identification of abnormalities in meristem development during proliferation and maturation processes, the environmental scanning electron microscope was used. In comparison to the classical light microscope, the non-commercial environmental scanning electron microscope AQUASEM II has been found as a very useful tool for the quick recognition of apical meristem disruption and abnormal development. To our knowledge, this is the first report discussing somatic embryogenesis in bog pine. Based on this observation, the cultivation procedure could be enhanced and the method for SE of bog pine optimized.

  13. Modular multimodal swept-source spectrally encoded scanning laser ophthalmoscopy and optical coherence tomography scan-head for surgical microscope-integrated and slit-lamp imaging

    Science.gov (United States)

    Malone, Joseph D.; Li, Jianwei D.; El-Haddad, Mohamed T.; Joos, Karen M.; Patel, Shriji N.; Tao, Yuankai K.

    2017-02-01

    Scanning laser ophthalmoscopy (SLO) and optical coherence tomography (OCT) enable noninvasive in vivo diagnostic imaging and provide complementary en face and depth-resolved visualization of ophthalmic structures, respectively. We previously demonstrated concurrent multimodal swept-source spectrally encoded scanning laser ophthalmoscopy and OCT (SS-SESLO-OCT) at 1060 nm using a swept-source and double clad fiber coupler. Here, we present system enhancements and novel designs for a modular SS-SESLO-OCT scan-head that can be coupled to ophthalmic surgical microscope-integrated and slit-lamp imaging optics. Multimodal SS-SESLO-OCT was demonstrated using a custom-built swept-source OCT engine with a 200 kHz 1060 nm source that was optically buffered for concurrent SESLO and OCT imaging at 100% duty cycle and 400 kHz sweep-rate. A shared optical relay and fast-axis galvanometer ensured inherent co-registration between SESLO and OCT field-of-views and concurrent acquisition of an en face SESLO image with each OCT cross-section. SESLO and OCT frames were acquired at 200 fps with 2560 x 2000 pix. (spectral x lateral). We show in vivo human ophthalmic imaging data using surgical microscope-integrated and slit-lamp imaging relays to demonstrate the utility of our SS-SESLO-OCT design. Our self-contained modular scan-head can be used for either intraoperative guidance or clinical diagnostics and reduces the complexity, cost, and maintenance required for clinical translation of these technologies. We believe concurrent multimodal SS-SESLO-OCT may benefit 1) intraoperative imaging by allowing for real-time surgical feedback, instrument tracking, and overlays of computationally extracted image-based surrogate biomarkers of disease, and 2) slit-lamp imaging by enabling aiming, image registration, and multi-field mosaicking.

  14. Quantitative in-situ scanning electron microscope pull-out experiments and molecular dynamics simulations of carbon nanotubes embedded in palladium

    Energy Technology Data Exchange (ETDEWEB)

    Hartmann, S., E-mail: steffen.hartmann@etit.tu-chemnitz.de; Blaudeck, T.; Hermann, S.; Wunderle, B. [Technische Universität Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Hölck, O. [Technische Universität Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer IZM Berlin, Gustav-Meyer-Allee 25, 13355 Berlin (Germany); Schulz, S. E.; Gessner, T. [Technische Universität Chemnitz, Reichenhainer Str. 70, 09126 Chemnitz (Germany); Fraunhofer ENAS Chemnitz, Technologie-Campus 3, 09126 Chemnitz (Germany)

    2014-04-14

    In this paper, we present our results of experimental and numerical pull-out tests on carbon nanotubes (CNTs) embedded in palladium. We prepared simple specimens by employing standard silicon wafers, physical vapor deposition of palladium and deposition of CNTs with a simple drop coating technique. An AFM cantilever with known stiffness connected to a nanomanipulation system was utilized inside a scanning electron microscope (SEM) as a force sensor to determine forces acting on a CNT during the pull-out process. SEM-images of the cantilever attached to a CNT have been evaluated for subsequent displacement steps with greyscale correlation to determine the cantilever deflection. We compare the experimentally obtained pull-out forces with values of numerical investigations by means of molecular dynamics and give interpretations for deviations according to material impurities or defects and their influence on the pull-out data. We find a very good agreement of force data from simulation and experiment, which is 17 nN and in the range of 10–61 nN, respectively. Our findings contribute to the ongoing research of the mechanical characterization of CNT-metal interfaces. This is of significant interest for the design of future mechanical sensors utilizing the intrinsic piezoresistive effect of CNTs or other future devices incorporating CNT-metal interfaces.

  15. Design of an affordable fluorescence confocal laser scanning microscope for medical diagnostics

    Science.gov (United States)

    Bechtel, Christin; Knobbe, Jens; Grüger, Heinrich; Lakner, Hubert

    2012-12-01

    Confocal fluorescence microscopes are a promising imaging tool in medical diagnostics due to their capability to selectively survey cross-sections of individual layers from `thick' samples. Non-invasive depth resolved investigation of neoplastic skin disorders is one example among other applications. However these microscopes are at present uncommon in medical practice. This is due to their main application area in research. The instruments dealt with here are generally complex, stationary units and are accordingly cost-intensive. It is for this reason, that we have designed a robust and portable MEMS based confocal fluorescence microscope with a field of view of 0.6mm x 0.6mm. This has been made possible by the integration of a 2D micro scanner mirror developed at Fraunhofer IPMS. A variable acquisition depth of cross-sectional images of the fluorescence specimen is enabled by an integrated z-shifter. With the use of commercially available optics an optical demonstrator set up has been realized. To characterize and to demonstrate the ability of this system test measurements were performed. The resolution of the microscope is better than 228 lp/mm determined by 1951 USAF resolution test target. Images of various biological samples are presented and optical sectioning capabilities are shown. A comparison of the measured with the predicted system performance will be given.

  16. [The developement of the near-field scan optical microscope and near-field spectroscopy].

    Science.gov (United States)

    Li, B; Zhang, S

    1997-08-01

    This paper introduces the basic principles and techniques of the near-field microscope and the status of recent development in the near-field spectroscopy. We also discuss problems facing the analysis of the results of the near-field spectra.

  17. Sparse sampling and reconstruction for electron and scanning probe microscope imaging

    Science.gov (United States)

    Anderson, Hyrum; Helms, Jovana; Wheeler, Jason W.; Larson, Kurt W.; Rohrer, Brandon R.

    2015-07-28

    Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

  18. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Labuda, Aleksander; Proksch, Roger [Asylum Research an Oxford Instruments Company, Santa Barbara, California 93117 (United States)

    2015-06-22

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  19. Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

    Science.gov (United States)

    Labuda, Aleksander; Proksch, Roger

    2015-06-01

    An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance, and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy. As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity—a longstanding goal in the electromechanical community.

  20. Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope.

    Science.gov (United States)

    Hanzelka, Pavel; Vonka, Jakub; Musilova, Vera

    2013-08-01

    We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance.

  1. Performance of signal-to-noise ratio estimation for scanning electron microscope using autocorrelation Levinson-Durbin recursion model.

    Science.gov (United States)

    Sim, K S; Lim, M S; Yeap, Z X

    2016-07-01

    A new technique to quantify signal-to-noise ratio (SNR) value of the scanning electron microscope (SEM) images is proposed. This technique is known as autocorrelation Levinson-Durbin recursion (ACLDR) model. To test the performance of this technique, the SEM image is corrupted with noise. The autocorrelation function of the original image and the noisy image are formed. The signal spectrum based on the autocorrelation function of image is formed. ACLDR is then used as an SNR estimator to quantify the signal spectrum of noisy image. The SNR values of the original image and the quantified image are calculated. The ACLDR is then compared with the three existing techniques, which are nearest neighbourhood, first-order linear interpolation and nearest neighbourhood combined with first-order linear interpolation. It is shown that ACLDR model is able to achieve higher accuracy in SNR estimation. © 2016 The Authors Journal of Microscopy © 2016 Royal Microscopical Society.

  2. Extracting the ridge set as a graph for actin filament length estimation from confocal laser scanning microscopic images

    Science.gov (United States)

    Birkholz, Harald

    2012-04-01

    The progress in image acquisition techniques provides life sciences with an abundance of data. Image analysis facilitates the assessment. The actin cytoskeleton plays a crucial role in understanding the behavior of osteoblastic cells on biomaterials. In the flat basal part of the cells, it can be visualized by confocal laser scanning microscopy. In the microscopic images, the stained cytoskeleton appears as a dense network of bright ridges which is so far only qualitatively assessed. For its quantification, there is a need for ridge detection techniques that provide a geometrical description of this graph feature. The state of the art methods do not cope with the systematical degradation by noise, unspecific luminance, and uneven dye uptake. This work presents the key part of a ridge-tracking technique, which makes more efficient use of context information, and evaluate it by its length measurement accuracy. Two random models illustrate the performance against ground truth. Representative microscopic images confirm the applicability.

  3. Miniature in vivo MEMS-based line-scanned dual-axis confocal microscope for point-of-care pathology

    Science.gov (United States)

    Yin, C.; Glaser, A.K.; Leigh, S. Y.; Chen, Y.; Wei, L.; Pillai, P. C. S.; Rosenberg, M. C.; Abeytunge, S.; Peterson, G.; Glazowski, C.; Sanai, N.; Mandella, M. J.; Rajadhyaksha, M.; Liu, J. T. C.

    2016-01-01

    There is a need for miniature optical-sectioning microscopes to enable in vivo interrogation of tissues as a real-time and noninvasive alternative to gold-standard histopathology. Such devices could have a transformative impact for the early detection of cancer as well as for guiding tumor-resection procedures. Miniature confocal microscopes have been developed by various researchers and corporations to enable optical sectioning of highly scattering tissues, all of which have necessitated various trade-offs in size, speed, depth selectivity, field of view, resolution, image contrast, and sensitivity. In this study, a miniature line-scanned (LS) dual-axis confocal (DAC) microscope, with a 12-mm diameter distal tip, has been developed for clinical point-of-care pathology. The dual-axis architecture has demonstrated an advantage over the conventional single-axis confocal configuration for reducing background noise from out-of-focus and multiply scattered light. The use of line scanning enables fast frame rates (16 frames/sec is demonstrated here, but faster rates are possible), which mitigates motion artifacts of a hand-held device during clinical use. We have developed a method to actively align the illumination and collection beams in a DAC microscope through the use of a pair of rotatable alignment mirrors. Incorporation of a custom objective lens, with a small form factor for in vivo clinical use, enables our device to achieve an optical-sectioning thickness and lateral resolution of 2.0 and 1.1 microns respectively. Validation measurements with reflective targets, as well as in vivo and ex vivo images of tissues, demonstrate the clinical potential of this high-speed optical-sectioning microscopy device. PMID:26977337

  4. Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

    Energy Technology Data Exchange (ETDEWEB)

    Sader, John E. [Department of Mathematics and Statistics, University of Melbourne, Victoria 3010 (Australia); Kavli Nanoscience Institute and Department of Physics, California Institute of Technology, Pasadena, California 91125 (United States); Sanelli, Julian A.; Adamson, Brian D.; Bieske, Evan J. [School of Chemistry, University of Melbourne, Victoria 3010 (Australia); Monty, Jason P.; Marusic, Ivan [Department of Mechanical Engineering, University of Melbourne, Victoria 3010 (Australia); Wei Xingzhan; Mulvaney, Paul [School of Chemistry, University of Melbourne, Victoria 3010 (Australia); Bio21 Institute, University of Melbourne, Victoria 3010 (Australia); Crawford, Simon A. [School of Botany, University of Melbourne, Victoria 3010 (Australia); Friend, James R. [Melbourne Centre for Nanofabrication, Clayton, Victoria 3800 (Australia); MicroNanophysics Research Laboratory, RMIT University, Melbourne, Victoria 3001 (Australia)

    2012-10-15

    The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions. This intrinsically uses the hydrodynamic function for a cantilever of rectangular plan view geometry. Here, we present hydrodynamic functions for a series of irregular and non-rectangular atomic force microscope cantilevers that are commonly used in practice. Cantilever geometries of arrow shape, small aspect ratio rectangular, quasi-rectangular, irregular rectangular, non-ideal trapezoidal cross sections, and V-shape are all studied. This enables the spring constants of all these cantilevers to be accurately and routinely determined through measurement of their resonant frequency and quality factor in fluid (such as air). An approximate formulation of the hydrodynamic function for microcantilevers of arbitrary geometry is also proposed. Implementation of the method and its performance in the presence of uncertainties and non-idealities is discussed, together with conversion factors for the static and dynamic spring constants of these cantilevers. These results are expected to be of particular value to the design and application of micro- and nanomechanical systems in general.

  5. Re-calibration of the NIST SRM 2059 master standard using traceable atomic force microscope metrology

    Science.gov (United States)

    Dixson, Ronald; Potzick, James; Orji, Ndubuisi G.

    2008-10-01

    The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth generation of such standards for mask metrology. An in house optical microscope tool developed at NIST, called the NIST ultra-violet (UV) microscope, was used in transmission mode to calibrate the SRM 2059 photomasks. Due to the limitations of available optical models for determining the edge response in the UV microscope, the tool was used in a comparator mode. One of the masks was selected as a master standard - and the features on this mask were calibrated using traceable critical dimension atomic force microscope (CD-AFM) dimensional metrology. The optical measurements were then used to determine the relative offsets between the widths on the master standard and individual masks for sale to customers. At the time of these measurements, however, the uncertainties in the CD-AFM reference metrology on the master standard were larger than can now be achieved because the NIST single crystal critical dimension reference material (SCCDRM) project had not been completed. Using our CD-AFM at NIST, we have performed new measurements on the SRM 2059 master standard. The new AFM results are in agreement with the prior measurements and have expanded uncertainties approximately one fourth of those of the earlier results for sub-micrometer features. When the optical comparator data for customers masks are reanalyzed using these new AFM results, we expect to reduce the combined reported uncertainties for the linewidths on the actual SRMs by at least 40 % for the nominal 0.25 μm features.

  6. Computer control of a scanning electron microscope for digital image processing of thermal-wave images

    Science.gov (United States)

    Gilbert, Percy; Jones, Robert E.; Kramarchuk, Ihor; Williams, Wallace D.; Pouch, John J.

    1987-01-01

    Using a recently developed technology called thermal-wave microscopy, NASA Lewis Research Center has developed a computer controlled submicron thermal-wave microscope for the purpose of investigating III-V compound semiconductor devices and materials. This paper describes the system's design and configuration and discusses the hardware and software capabilities. Knowledge of the Concurrent 3200 series computers is needed for a complete understanding of the material presented. However, concepts and procedures are of general interest.

  7. High sensitivity detection of protein molecules picked up on a probe of atomic force microscope based on the fluorescence detection by a total internal reflection fluorescence microscope.

    Science.gov (United States)

    Yamada, Takafumi; Afrin, Rehana; Arakawa, Hideo; Ikai, Atsushi

    2004-07-02

    We developed a method to detect and identify proteins on a probe of the atomic force microscope (AFM) with a high sensitivity. Due to a low background noise of the total internal reflection fluorescence microscope employed as a detecting system, we were able to achieve a high enough sensitivity to detect zeptomole orders of protein molecules immobilized on the tip. Several different methods to immobilize protein molecules to AFM-probes were tested, meant for a wide range of applications of this method. Furthermore, we demonstrated that different proteins were clearly distinguished by immunofluorescence microscopy on the probe using their specific antibodies.

  8. Localization of actin filaments in internodal cells of characean algae. A scanning and transmission electron microscope study

    Science.gov (United States)

    1976-01-01

    New methods of visualizing subcortical actin filament bundles, or fibrils, in Characean internodes confirm that they are associated with chloroplasts at the surface facing the streaming endoplasm, and reveal that they are continuous over long distances. With the scanning electron microscope, an average of four to six fibrils are seen bridging a file of chloroplasts. The same configuration appears in negatively stained preparations of large blocks of chloroplast files connected by actin fibrils. Few branches of the subcortical fibrils are evident. These findings are discussed with respect to the mechanism of cytoplasmic streaming in Characeae. PMID:1245548

  9. An ultra-low temperature scanning Hall probe microscope for magnetic imaging below 40 mK

    OpenAIRE

    Karci Ozgur; Piatek Julian O.; Jorba Pau; Dede Munir; Ronnow Henrik M.; Oral Ahmet

    2014-01-01

    We describe the design of a low temperature scanning Hall probe microscope (SHPM) for a dilution refrigerator system. A detachable SHPM head with 25.4 mm OD and 200 mm length is integrated at the end of the mixing chamber base plate of the dilution refrigerator insert (Oxford Instruments, Kelvinox MX-400) by means of a dedicated docking station. It is also possible to use this detachable SHPM head with a variable temperature insert (VTI) for 2 K-300 K operations. A microfabricated 1 mu m size...

  10. Controlling molecular condensation/diffusion of copper phthalocyanine by local electric field induced with scanning tunneling microscope tip

    Science.gov (United States)

    Nagaoka, Katsumi; Yaginuma, Shin; Nakayama, Tomonobu

    2018-02-01

    We have discovered the condensation/diffusion phenomena of copper phthalocyanine (CuPc) molecules controlled with a pulsed electric field induced by the scanning tunneling microscope tip. This behavior is not explained by the conventional induced dipole model. In order to understand the mechanism, we have measured the electronic structure of the molecule by tunneling spectroscopy and also performed theoretical calculations on molecular orbitals. These data clearly indicate that the molecule is positively charged owing to charge transfer to the substrate, and that hydrogen bonding exists between CuPc molecules, which makes the molecular island stable.

  11. Effects of Naphthalene on DNA and RNA quantity in Amoeba proteus by using confocal laser scanning microscope

    Directory of Open Access Journals (Sweden)

    Khwanmuni, J.

    2006-01-01

    Full Text Available Effects of Naphthalene which is a carcinogen on changes of DNA and RNA quantities were studied with acridine orange stained cells under a confocal laser scanning microscope. It was found that DNA and RNA in amoebae nucleus and cytoplasm, reared in 0 (control, 3 and 8.85 mg/l (24h-LD50 at 0 and 12 h. showed a statistically significant difference (p<0.05. The more naphthalene concentrations and larger incubation periods had greater effects on DNA and RNA decreases in amoebae nucleus and cytoplasm.

  12. Computer Archiving and Image Enhancement of Diagnostic Electron Micrographs Using Scanning Transmission Electron Microscope as Real-Time Digitizer

    Science.gov (United States)

    Okagaki, T.; Jones, M.H.; Clark, B.A.; Pan, T.; Ferro, J.M.; Hsing, R.; Tzou, K.H.

    1984-01-01

    Diagnostic electron micrographs were digitized in real time using a scanning transmission electron microscope (STEM) controlled by a devoted front end processor at a resolution of 1K × 1K × 8. Various methods of image enhancement produced satisfactory results. From our experience, a faster front end processor with a larger memory size and 2K × 2K or 4K × 4K spatial resolution of an image are desirable. In order to facilitate storage and retrieval of an image archive, efficient data compression is necessary. ImagesFig. 2Fig. 3

  13. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.

    Science.gov (United States)

    Long, Christian J; Cannara, Rachel J

    2015-07-01

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  14. Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

    Energy Technology Data Exchange (ETDEWEB)

    Long, Christian J., E-mail: christian.long@nist.gov [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States); Maryland Nanocenter, University of Maryland, College Park, Maryland 20742 (United States); Cannara, Rachel J. [Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)

    2015-07-15

    Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

  15. Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

    Science.gov (United States)

    Zhong, Jian; He, Dannong

    2015-08-01

    Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine (HUMTM)-atomic force microscope (AFM) system is developed by modifying UMTM to combine with AFM and designing a height-adjustable stabilizing apparatus. Then the combined HUMTM-AFM system is evaluated. Finally, as initial demonstrations, it is applied to analyze the relationship among macroscopic mechanical properties, surface nanomorphological changes under external force, and fracture processes of two kinds of representative large scale thin film materials: polymer material with high strain rate (Parafilm) and metal material with low strain rate (aluminum foil). All the results demonstrate the combined HUMTM-AFM system overcomes several disadvantages of current AFM-combined tensile/compression devices including small load force, incapability for large scale specimens, disability for materials with high strain rate, and etc. Therefore, the combined HUMTM-AFM system is a promising tool for materials research in the future.

  16. A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging

    Science.gov (United States)

    Wu, Ying; Shi, Jian; Su, Chanmin; Zou, Qingze

    2009-04-01

    In this article, an approach based on the recently developed inversion-based iterative control (IIC) to cancel the cross-axis coupling effect of piezoelectric tube scanners (piezoscanners) in tapping-mode atomic force microscope (AFM) imaging is proposed. Cross-axis coupling effect generally exists in piezoscanners used for three-dimensional (x-y-z axes) nanopositioning in applications such as AFM, where the vertical z-axis movement can be generated by the lateral x-y axes scanning. Such x /y-to-z cross-coupling becomes pronounced when the scanning is at large range and/or at high speed. In AFM applications, the coupling-caused position errors, when large, can generate various adverse effects, including large imaging and topography distortions, and damage of the cantilever probe and/or the sample. This paper utilizes the IIC technique to obtain the control input to precisely track the coupling-caused x /y-to-z displacement (with sign-flipped). Then the obtained input is augmented as a feedforward control to the existing feedback control in tapping-mode imaging, resulting in the cancellation of the coupling effect. The proposed approach is illustrated through two exemplary applications in industry, the pole-tip recession examination, and the nanoasperity measurement on hard-disk drive. Experimental results show that the x /y-to-z coupling effect in large-range (20 and 45 μm) tapping-mode imaging at both low to high scan rates (2, 12.2 to 24.4 Hz) can be effectively removed.

  17. Quantification of carbon contamination under electron beam irradiation in a scanning transmission electron microscope and its suppression by plasma cleaning

    Energy Technology Data Exchange (ETDEWEB)

    Griffiths, A J V; Walther, T, E-mail: t.walther@sheffield.ac.u [Department of Electronic and Electrical Engineering, University of Sheffield, Sir Frederick Mappin Building, Mappin Street, Sheffield S1 3JD (United Kingdom)

    2010-07-01

    We have measured the build-up of carbon surface contamination as a function of time and irradiated area size for various specimens in a JEOL 2010F (scanning) transmission electron microscope, employing both t/{lambda} mapping with our Gatan imaging filter and recording changes in annular dark-field image intensity. It is shown that the total number of carbon atoms deposited per time for a given beam intensity is roughly constant at room temperature for as-received specimens while it is significantly lower for plasma cleaned specimens. This explains why contamination is generally only an issue at the highest magnifications where the contamination regions become smaller and the carbon layers correspondingly thicker. A Fischione plasma cleaner was then used to remove these carbon layers, and the rate of carbon removal has been determined for contamination spots produced in stationary spot mode as well as for extended regions scanned for a minute so that optimal cleaning times can be chosen.

  18. Real-time scanning charged-particle microscope image composition with correction of drift.

    Science.gov (United States)

    Cizmar, Petr; Vladár, András E; Postek, Michael T

    2011-04-01

    In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift distortion commonly causes blur and distortions in the SEM images. Such corruption ordinarily appears when conventional image-acquisition methods, i.e., "slow scan" and "fast scan," are applied. The damage is often very significant; it may render images unusable for metrology applications, especially where subnanometer accuracy is required. The described correction technique works with a large number of quickly taken frames, which are properly aligned and then composed into a single image. Such image contains much less noise than the individual frames, while the blur and deformation is minimized. This technique also provides useful information about changes of the sample position in time, which may be applied to investigate the drift properties of the instrument without a need of additional equipment.

  19. Plasmon resonance and the imaging of metal-impregnated neurons with the laser scanning confocal microscope

    OpenAIRE

    Thompson, Karen J; Harley, Cynthia M.; Barthel, Grant M; Sanders, Mark A.; Mesce, Karen A.

    2015-01-01

    eLife digest A fresh slice of brain tissue has a fairly uniform appearance, even when viewed under a microscope. To study the neurons and other cells in the brain, scientists must therefore first prepare tissue samples using methods that make it easier to see certain kinds of cells, or particular features of them. One method that has been available for over a century is to use metal particles to stain some of the cells. For example, when the Spanish anatomist Santiago Ram?n y Cajal investigat...

  20. Microstructure characterization of Al matrix composite reinforced with Ti-6Al-4V meshes after compression by scanning electron microscope and transmission electron microscope.

    Science.gov (United States)

    Guo, Q; Sun, D L; Han, X L; Cheng, S R; Chen, G Q; Jiang, L T; Wu, G H

    2012-02-01

    Compressive properties of Al matrix composite reinforced with Ti-6Al-4V meshes (TC4(m)/5A06 Al composite) under the strain rates of 10(-3)S(-1) and 1S(-1) at different temperature were measured and microstructure of composites after compression was characterized by scanning electron microscope (SEM) and transmission electron microscope (TEM). Compressive strength decreased with the test temperature increased and the strain-rate sensitivity (R) of composite increased with the increasing temperature. SEM observations showed that grains of Al matrix were elongated severely along 45° direction (angle between axis direction and fracture surface) and TC4 fibres were sheared into several parts in composite compressed under the strain rate of 10(-3)S(-1) at 25°C and 250°C. Besides, amounts of cracks were produced at the interfacial layer between TC4 fibre and Al matrix and in (Fe, Mn)Al(6) phases. With the compressive temperature increasing to 400°C, there was no damage at the interfacial layer between TC4 fibre and Al matrix and in (Fe, Mn)Al(6) phases, while equiaxed recrystal grains with sizes about 10 μm at the original grain boundaries of Al matrix were observed. However, interface separation of TC4 fibres and Al matrix occurred in composite compressed under the strain rate of 1S(-1) at 250°C and 400°C. With the compressive temperature increasing from 25°C to 100°C under the strain rate of 10(-3) S(-1), TEM microstructure in Al matrix exhibited high density dislocations and slipping bands (25°C), polygonized dislocations and dynamic recovery (100°C), equiaxed recrystals with sizes below 500 μm (250°C) and growth of equiaxed recrystals (400°C), respectively. Copyright © 2011 Elsevier Ltd. All rights reserved.

  1. On the influence of the sputtering in determining the resolution of a scanning ion microscope

    NARCIS (Netherlands)

    Castaldo, V.; Hagen, C.W.; Kruit, P.; Van Veldhoven, E.; Maas, D.

    2009-01-01

    The determination of the quality of an imaging system is not an easy task for, in general, at least three parameters, strictly interdependent, concur in defining it: resolution, contrast, and signal-to-noise ratio. The definition of resolution itself in scanning microscopy is elusive and the case of

  2. Dynamic experimentation on the confocal laser scanning microscope : application to soft-solid, composite food materials

    NARCIS (Netherlands)

    Plucknett, K.P.; Pomfret, S.J.; Normand, V.; Ferdinando, D.; Veerman, C.; Frith, W.J.; Norton, I.T.

    2001-01-01

    Confocal laser scanning microscopy (CLSM) is used to follow the dynamic structural evolution of several phase-separated mixed biopolymer gel composites. Two protein/polysaccharide mixed gel systems were examined: gelatin/maltodextrin and gelatin/agarose. These materials exhibit 'emulsion-like'

  3. Evaluation of the effect of cigarette smoking on the olfactory neuroepithelium of New Zealand white rabbit, using scanning electron microscope.

    Science.gov (United States)

    Iskander, Nagi M; El-Hennawi, Diaa M; Yousef, Tarek F; El-Tabbakh, Mohammed T; Elnahriry, Tarek A

    2017-06-01

    To detect ultra-structural changes of Rabbit's olfactory neuro-epithelium using scanning electron microscope after exposure to cigarette smoking. Sixty six rabbits (Pathogen free New Zealand white rabbits weighing 1-1.5 kg included in the study were randomly assigned into one of three groups: control group did not expose to cigarette smoking, study group 1 was exposed to cigarette smoking for 3 months and study group 2 was exposed to cigarette smoking 3 months and then stopped for 2 months. Olfactory neuro-epithelium from all rabbits were dissected and examined under Philips XL-30 scanning electron microscope. Changes that were found in the rabbits of study group 1 in comparison to control group were loss of microvilli of sustentacular cells (p = 0.016) and decreases in distribution of specialized cilia of olfactory receptor cells (p = 0.046). Also respiratory metaplasia was detected. These changes were reversible in study group 2. Cigarette smoking causes ultra-structural changes in olfactory neuro-epithelium which may explain why smell was affected in cigarette smokers. Most of these changes were reversible after 45 days of cessation of cigarette smoking to the rabbits.

  4. An in vitro scanning electron microscopic study comparing MTAD (intracanal irrigant and various root biomodifiers on periodontally involved human teeth

    Directory of Open Access Journals (Sweden)

    Charu Tandon

    2014-01-01

    Full Text Available Background: Smear layer removal and collagen fiber exposure may improve regeneration outcome, which can be accomplished by use of root biomodifiers. These enhance the degree of connective tissue attachment to denuded roots. The objective of this in vitro scanning electron microscopic study was to comparatively evaluate mixture of tetracycline (TTC and acid and detergent (MTAD and other root biomodifiers for smear layer removal on periodontally involved human teeth. Materials and Methods: Forty human teeth were collected and stored in saline. After scaling and root planning, two samples were obtained from each tooth. A total of 80 dentin blocks were randomly divided into four groups: MTAD, TTC hydrochloride (TTC HCl, citric acid (CA, and normal saline. The agents were applied for 3 min by active burnishing. Immediately following treatment, the specimens were rinsed, dehydrated, fixed and prepared for scanning electron microscope and was examined at Χ3500 magnification. Previously trained blind examiners evaluated photomicrographs using Sampaio′s index (2005. Statistical analysis was performed. Results: MTAD is most efficacious in removing smear layer and showed statistically significant dentinal tubules opening, followed by TTC HCl and CA. Conclusion: MTAD and conventional root biomodifiers used in the study alters the dentin surface by smear layer removal and exposure of dentinal tubules. Hence, MTAD as a root biomodifier may have a significant role in periodontal regeneration .

  5. Multi-color quantum dot tracking using a high-speed hyperspectral line-scanning microscope.

    Science.gov (United States)

    Cutler, Patrick J; Malik, Michael D; Liu, Sheng; Byars, Jason M; Lidke, Diane S; Lidke, Keith A

    2013-01-01

    Many cellular signaling processes are initiated by dimerization or oligomerization of membrane proteins. However, since the spatial scale of these interactions is below the diffraction limit of the light microscope, the dynamics of these interactions have been difficult to study on living cells. We have developed a novel high-speed hyperspectral microscope (HSM) to perform single particle tracking of up to 8 spectrally distinct species of quantum dots (QDs) at 27 frames per second. The distinct emission spectra of the QDs allows localization with ∼10 nm precision even when the probes are clustered at spatial scales below the diffraction limit. The capabilities of the HSM are demonstrated here by application of multi-color single particle tracking to observe membrane protein behavior, including: 1) dynamic formation and dissociation of Epidermal Growth Factor Receptor dimers; 2) resolving antigen induced aggregation of the high affinity IgE receptor, FcεR1; 3) four color QD tracking while simultaneously visualizing GFP-actin; and 4) high-density tracking for fast diffusion mapping.

  6. Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Hovden, Robert, E-mail: rmh244@cornell.edu [School of Applied and Engineering Physics, Cornell University, Ithaca, NY 148532 (United States); Muller, David A. [School of Applied and Engineering Physics, Cornell University, Ithaca, NY 148532 (United States); Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY 14853 (United States)

    2012-12-15

    Mono-atomic-layer membranes such as graphene offer new opportunities for imaging and detecting individual light atoms in transmission electron microscopes (TEM). For such applications where multiple scattering and diffraction effects are weak, we evaluate the detection efficiency and interpretability of single atom images for the most common detector geometries using quantitative quantum mechanical simulations. For well-resolved and atomically-thin specimens, the low angle annular dark field (LAADF) detector can provide a significant increase in signal-to-noise over other common detector geometries including annular bright field and incoherent bright field. This dramatically improves the visibility of organic specimens on atomic-layer membranes. Simulations of Adenosine Triphosphate (ATP) imaged under ideal conditions indicate the minimal dose requirements for elastic imaging by STEM or conventional TEM still exceed previously reported dose limits. -- Highlights: Black-Right-Pointing-Pointer Graphene offers new opportunities for imaging individual light atoms in electron microscopes. Black-Right-Pointing-Pointer For ultrathin materials, a low angle annular dark field detector can provide a SNR comparable to TEM. Black-Right-Pointing-Pointer LAADF dramatically improves the visibility of organic specimens on atomic-layer membranes. Black-Right-Pointing-Pointer Simulations for atomic imaging of ATP nucleotides exceed the molecules' dose limits.

  7. Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

    Energy Technology Data Exchange (ETDEWEB)

    Inada, H. [Brookhaven National Laboratory, Upton, NY 11973 (United States); Hitachi High Technologies Corp., Ibaraki (Japan); Su, D. [Brookhaven National Laboratory, Upton, NY 11973 (United States); Egerton, R.F. [University of Alberta, Edmonton (Canada); Konno, M. [Hitachi High Technologies Corp., Ibaraki (Japan); Wu, L.; Ciston, J.; Wall, J. [Brookhaven National Laboratory, Upton, NY 11973 (United States); Zhu, Y., E-mail: zhu@bnl.gov [Brookhaven National Laboratory, Upton, NY 11973 (United States)

    2011-06-15

    We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization. -- Research highlights: {yields} Atomic imaging using secondary electrons in an aberration-corrected electron microscope. {yields} High-resolution secondary electron imaging mechanism. {yields} Image contrast quantification and as functions of imaging conditions. {yields} Simultaneous acquisition of atomic images from surface and bulk.

  8. Environmental, scanning electron and optical microscope image analysis software for determining volume and occupied area of solid-state fermentation fungal cultures.

    Science.gov (United States)

    Osma, Johann F; Toca-Herrera, José L; Rodríguez-Couto, Susana

    2011-01-01

    Here we propose a software for the estimation of the occupied area and volume of fungal cultures. This software was developed using a Matlab platform and allows analysis of high-definition images from optical, electronic or atomic force microscopes. In a first step, a single hypha grown on potato dextrose agar was monitored using optical microscopy to estimate the change in occupied area and volume. Weight measurements were carried out to compare them with the estimated volume, revealing a slight difference of less than 1.5%. Similarly, samples from two different solid-state fermentation cultures were analyzed using images from a scanning electron microscope (SEM) and an environmental SEM (ESEM). Occupied area and volume were calculated for both samples, and the results obtained were correlated with the dry weight of the cultures. The difference between the estimated volume ratio and the dry weight ratio of the two cultures showed a difference of 10%. Therefore, this software is a promising non-invasive technique to determine fungal biomass in solid-state cultures.

  9. Characterizing absolute piezoelectric microelectromechanical system displacement using an atomic force microscope

    Energy Technology Data Exchange (ETDEWEB)

    Evans, J., E-mail: radiant@ferrodevices.com; Chapman, S., E-mail: radiant@ferrodevices.com [Radiant Technologies, Inc., 2835C Pan American Fwy NE, Albuquerque, New Mexico 87107 (United States)

    2014-08-14

    Piezoresponse Force Microscopy (PFM) is a popular tool for the study of ferroelectric and piezoelectric materials at the nanometer level. Progress in the development of piezoelectric MEMS fabrication is highlighting the need to characterize absolute displacement at the nanometer and Ångstrom scales, something Atomic Force Microscopy (AFM) might do but PFM cannot. Absolute displacement is measured by executing a polarization measurement of the ferroelectric or piezoelectric capacitor in question while monitoring the absolute vertical position of the sample surface with a stationary AFM cantilever. Two issues dominate the execution and precision of such a measurement: (1) the small amplitude of the electrical signal from the AFM at the Ångstrom level and (2) calibration of the AFM. The authors have developed a calibration routine and test technique for mitigating the two issues, making it possible to use an atomic force microscope to measure both the movement of a capacitor surface as well as the motion of a micro-machine structure actuated by that capacitor. The theory, procedures, pitfalls, and results of using an AFM for absolute piezoelectric measurement are provided.

  10. Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope

    Directory of Open Access Journals (Sweden)

    S. Ernst, S. Wirth, M. Rams, V. Dolocan and F. Steglich

    2007-01-01

    Full Text Available This work deals with the preparation and characterization of tungsten tips for the use in UHV low-temperature scanning tunneling microscopy and spectroscopy (STM and STS, respectively. These specific environments require in situ facilities for tip conditioning, for further sharpening of the tips, as well as for reliable tip characterization. The implemented conditioning methods include direct resistive annealing, annealing by electron bombardment, and self-sputtering with noble gas ions. Moreover, results from in situ tip characterization by field emission and STM experiments were compared to ex situ scanning electron microscopy. Using the so-prepared tips, high resolution STM images and tunneling spectra were obtained in a temperature range from ambient down to 350 mK, partially with applied magnetic field, on a variety of materials.

  11. In-situ investigation of laser surface modifications of WC-Co hard metals inside a scanning electron microscope

    Science.gov (United States)

    Mueller, H.; Wetzig, K.; Schultrich, B.; Pompe, Wolfgang; Chapliev, N. I.; Konov, Vitaly I.; Pimenov, S. M.; Prokhorov, Alexander M.

    1989-05-01

    The investigation of laser interaction with solid surfaces and of the resulting mechanism of surface modification are of technical interest to optimize technological processes, and they are also of fundamental scientific importance. Most instructive indormation is available with the ail of the in-situ techniques. For instance, measuring of the photon emission of the irradiated surface ane the plasma torch (if it is produced) simultaneously to laser action, makes it possible to gain a global characterization of the laser-solid interaction. In order to obtain additional information about surface and structure modifications in microscopic detail , a laser and scanning electron microscope were combined in to a tandem equipment (LASEM). Inside this eqiipment the microscopic observation is carried out directly at the laser irradiated area without any displacement of the sample. In this way, the stepwise development of surface modification during multipulse irradiation is visible in microscopic details and much more reliable information about the surface modification process is obtainable in comparison to an external laser irradiation. Such kind of equipments were realized simultaneously and independently in the Institut of General Physics (Moscow) and the Central Institute of Solid State Physics and Material Research (Dresden) using a CO2 and a LTd-glass-laser, respectively. In the following the advantages and possibilities of a LASEM shall be demonstrated by some selected investigations of WC-CO hardmeta. The results were obtained in collaboration by both groups with the aid of the pulsed CO2-laser. The TEA CO2 laser was transmitted through a ZnSe-window into the sample chamber of the SEM and focused ofAo tfte sample surface. It was operated in TEM - oo mode with a repetition rate of about 1 pulse per second. A peak power density of about 160 MW/cm2 was achieved in front of the sample surface.

  12. Design and calibration of a scanning tunneling microscope for large machined surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Grigg, D.A.; Russell, P.E.; Dow, T.A.

    1988-12-01

    During the last year the large sample STM has been designed, built and used for the observation of several different samples. Calibration of the scanner for prope dimensional interpretation of surface features has been a chief concern, as well as corrections for non-linear effects such as hysteresis during scans. Several procedures used in calibration and correction of piezoelectric scanners used in the laboratorys STMs are described.

  13. Scanning electron microscopical observations on the shedding of the tegument of adult Schistosoma mattheei.

    Science.gov (United States)

    Kruger, F J; Joubert, P H

    1990-11-01

    In search of indications of membrane turnover the teguments of male Schistosoma mattheei from cattle and laboratory rodents were studied by means of scanning electron microscopy. A number of slightly elevated circular patches of tegument which appeared to peel off on the edges were seen on the outer membrane of a limited number of specimens from both rodents and cattle. It is suggested that this phenomenon may represent limited rapid turnover of the outer layer in response to host immunological action.

  14. The Dentin Tubule System: A Replica and Scanning Electron Microscope Study.

    Science.gov (United States)

    1978-06-20

    this laboratory to prepare soft and calci fied tissues for scanning and transmission electron microscopy. The resolution, magnification range and...several intertubular connections , originally examined at a magnification of 17,000 times (Fig. 7). In addition to the omnipresent lateral tubule...branches , and the ease of penetration therein of endodontic reagents from the pulp. Intratubular network throughout the dentin may be a route of intra

  15. A scanning electron microscopic evaluation of different root canal irrigation regimens

    OpenAIRE

    Chaves Medici Mônika; Izabel Cristina Fröner

    2006-01-01

    The purpose of this study was to assess the effectiveness of endodontic irrigants in removing the smear layer from instrumented root canal walls using Scanning Electron Microscopy (SEM). The endodontic irrigants used were: 1% sodium hypochlorite (NaOCl); 1% NaOCl mixed to 17% EDTAC; 2% chlorhexidine gel; and Ricinus communis gel. Photomicrographs of the middle and apical thirds were evaluated with the aid of the Fotoscore - v. 2.0 software. The results indicated that the mixture of sodium hyp...

  16. Imaging optical fields below metal films and metal-dielectric waveguides by a scanning microscope

    Science.gov (United States)

    Zhu, Liangfu; Wang, Yong; Zhang, Douguo; Wang, Ruxue; Qiu, Dong; Wang, Pei; Ming, Hai; Badugu, Ramachandram; Rosenfeld, Mary; Lakowicz, Joseph R.

    2017-09-01

    Laser scanning confocal fluorescence microscopy (LSCM) is now an important method for tissue and cell imaging when the samples are located on the surfaces of glass slides. In the past decade, there has been extensive development of nano-optical structures that display unique effects on incident and transmitted light, which will be used with novel configurations for medical and consumer products. For these applications, it is necessary to characterize the light distribution within short distances from the structures for efficient detection and elimination of bulky optical components. These devices will minimize or possibly eliminate the need for free-space light propagation outside of the device itself. We describe the use of the scanning function of a LSCM to obtain 3D images of the light intensities below the surface of nano-optical structures. More specifically, we image the spatial distributions inside the substrate of fluorescence emission coupled to waveguide modes after it leaks through thin metal films or dielectric-coated metal films. The observed spatial distribution were in general agreement with far-field calculations, but the scanning images also revealed light intensities at angles not observed with classical back focal plane imaging. Knowledge of the subsurface optical intensities will be crucial in the combination of nano-optical structures with rapidly evolving imaging detectors.

  17. Sensorless enhancement of an atomic force microscope micro-cantilever quality factor using piezoelectric shunt control.

    Science.gov (United States)

    Fairbairn, M; Moheimani, S O R

    2013-05-01

    The image quality and resolution of the Atomic Force Microscope (AFM) operating in tapping mode is dependent on the quality (Q) factor of the sensing micro-cantilever. Increasing the cantilever Q factor improves image resolution and reduces the risk of sample and cantilever damage. Active piezoelectric shunt control is introduced in this work as a new technique for modifying the Q factor of a piezoelectric self-actuating AFM micro-cantilever. An active impedance is placed in series with the tip oscillation voltage source to modify the mechanical dynamics of the cantilever. The benefit of using this control technique is that it removes the optical displacement sensor from the Q control feedback loop to reduce measurement noise in the loop and allows for a reduction in instrument size.

  18. Nanometer-scale lithography of ultrathin films with atomic force microscope

    CERN Document Server

    Kim, J C; Shin, Y W; Park, S W

    1998-01-01

    Ultrathin resist films have been prepared by both Langmuir-Blodgett (LB) and self-assembly (SA) techniques. Nanometer-scale patterning of these thin films has been performed by using the atomic force microscope (AFM) as the exposing tool. The poly (methylphenylmethacrylate) (PMPMA) LB films were prepared and fabricated by AFM lithography. When the exposure was carried out at the bias voltage of -25V, the protruding lines appeared in the exposed regions. The preoptimized LB films at various conditions exhibited 120 nm line resolution. An organosilane monolayer composed of octadecyldimethylsilyl groups was prepared on a Si substrate. It was then patterned through the localized degradation of the monolayer due to anodic reaction induced by an AFM tip. When the bias voltage was -30 V, the protruding lines appeared in the exposed regions.

  19. Site-controlled quantum dots fabricated using an atomic-force microscope assisted technique

    Directory of Open Access Journals (Sweden)

    Sakuma Y

    2006-01-01

    Full Text Available AbstractAn atomic-force microscope assisted technique is developed to control the position and size of self-assembled semiconductor quantum dots (QDs. Presently, the site precision is as good as ± 1.5 nm and the size fluctuation is within ± 5% with the minimum controllable lateral diameter of 20 nm. With the ability of producing tightly packed and differently sized QDs, sophisticated QD arrays can be controllably fabricated for the application in quantum computing. The optical quality of such site-controlled QDs is found comparable to some conventionally self-assembled semiconductor QDs. The single dot photoluminescence of site-controlled InAs/InP QDs is studied in detail, presenting the prospect to utilize them in quantum communication as precisely controlled single photon emitters working at telecommunication bands.

  20. The relation of apple texture with cell wall nanostructure studied using an atomic force microscope.

    Science.gov (United States)

    Cybulska, Justyna; Zdunek, Artur; Psonka-Antonczyk, Katarzyna M; Stokke, Bjørn T

    2013-01-30

    In this study, the relation of the nanostructure of cell walls with their texture was investigated for six different apple cultivars. Cell wall material (CWM) and cellulose microfibrils were imaged by atomic force microscope (AFM). The mean diameter of cellulose microfibrils for each cultivar was estimated based on the AFM height topographs obtained using the tapping mode of dried specimens. Additionally, crystallinity of cellulose microfibrils and pectin content was determined. Texture of apple cultivars was evaluated by sensory and instrumental analysis. Differences in cellulose diameter as determined from the AFM height topographs of the nanostructure of cell walls of the apple cultivars are found to relate to the degree of crystallinity and pectin content. Cultivars with thicker cellulose microfibrils also revealed crisper, harder and juicier texture, and greater acoustic emission. The data suggest that microfibril thickness affects the mechanical strength of cell walls which has consequences for sensory and instrumental texture. Copyright © 2012 Elsevier Ltd. All rights reserved.

  1. Serum induced degradation of 3D DNA box origami observed by high speed atomic force microscope

    DEFF Research Database (Denmark)

    Jiang, Zaixing; Zhang, Shuai; Yang, Chuanxu

    2015-01-01

    3D DNA origami holds tremendous potential to encapsulate and selectively release therapeutic drugs. Observations of real-time performance of 3D DNA origami structures in physiological environment will contribute much to its further applications. Here, we investigate the degradation kinetics of 3D...... DNA box origami in serum using high-speed atomic force microscope optimized for imaging 3D DNA origami in real time. The time resolution allows characterizing the stages of serum effects on individual 3D DNA box origami with nanometer resolution. Our results indicate that the whole digest process...... is a combination of a rapid collapse phase and a slow degradation phase. The damages of box origami mainly happen in the collapse phase. Thus, the structure stability of 3D DNA box origami should be further improved, especially in the collapse phase, before clinical applications...

  2. Wet-chemical nanoscale patterning of GaAs surfaces using atomic force microscope lithography

    Science.gov (United States)

    Klehn, B.; Skaberna, S.; Kunze, U.

    1999-01-01

    Sub-100 nm V-grooves in GaAs(001) surfaces have been fabricated by patterning a thin photoresist layer with an atomic force microscope (AFM) and subsequent wet-chemical etching. The nanolithography is based on the dynamic ploughing technique. Anisotropic etchants under investigation are bromine-methanol-isopropanol, sulfuric acid-hydrogen peroxide-water, citric acid-hydrogen peroxide-water, and ammonium hydroxide-hydrogen peroxide-water. Along the [11¯0] direction the etched grooves are V-shaped, along [11¯0] the profile is U-shaped. Best results of 50-60-nm wide V-grooves with straight edges and smooth sidewalls are obtained from bromine-methanol-isopropanol, the other etchants form rough grooves. Concerning the reproducibility of the patterning process, the aqueous etch solutions exceed the bromine etchant.

  3. A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Jizhong He

    2013-01-01

    Full Text Available We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM for hard disk drive (HDD media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.

  4. Assessment of a CAD scheme in selecting the optimal focused microscopic scanning images of the metaphase chromosomes

    Science.gov (United States)

    Wang, Xingwei; Tan, Jun; Qiu, Yuchen; Li, Yuhua; Liu, Hong; Li, Shibo; Zheng, Bin

    2011-03-01

    Visually searching for analyzable metaphase chromosome cells under microscopes is a routine and timeconsuming task in genetic laboratories to diagnose cancer and genetic disorders. To improve detection efficiency, consistency, and accuracy, we developed an automated microscopic image scanning system using a 100X oil immersion objective lens to acquire images that has sufficient spatial resolution allowing clinicians to do diagnosis. Due to the highresolution, the field of image depth is very limited and multiple scans up to seven layers are required. Thus, a metaphase cell can spread over multiple images at different focal levels. Among them only one or two are adequate for the diagnosis and the others are typically fuzzy images. In this study, we developed and tested a computer-aided detection (CAD) scheme to automatically select one image with the sharpest image quality and discard all of the other fuzzy images based on the computed sharpness index. From three scanned bone marrow specimen slides, the on-line and offline metaphase finding modules automatically selected 100 chromosome cells with 534 images. These images were selected to build a testing dataset. For each cell, the CAD scheme selects one image with the maximum sharpness index. Three observers also independently visually selected one best image for diagnosis from each cell. The agreement rate between CAD and visually selected images ranges from 89% to 96%, which is also very comparable to the agreement rate between the two observers. This experiment demonstrated the feasibility of applying a CAD scheme to select the images with sharpest high-resolution metaphase chromosome cell and potentially improve diagnostic efficiency and accuracy in the future clinical practice.

  5. Direct observation of phase transition of GeSbTe thin films by Atomic Force Microscope

    Energy Technology Data Exchange (ETDEWEB)

    Yang Fei [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Xu Ling, E-mail: xuling@nju.edu.cn [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Zhang Rui; Geng Lei; Tong Liang; Xu Jun [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China); Su Weining; Yu Yao [National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093 (China); Ma Zhongyuan; Chen Kunji [National Laboratory of Solid State Microstructures and Jiangsu Provincial Key Laboratory of Photonic and Electronic Materials Sciences and Technology, School of Electronic Science and Engineering, Nanjing University, Nanjing 210093 (China)

    2012-10-01

    Graphical abstract: Nano-sized marks on GST thin film were fabricated using Conductive-AFM (Atomic Force Microscope). The AFM morphology images show that the marks are ablated at the center and a raised ring surrounding it. Highlights: Black-Right-Pointing-Pointer Microstructure of GeSbTe thin films was characterized by XRD and AFM. Black-Right-Pointing-Pointer Annealing and applying electrical field can induce crystallization on thin film. Black-Right-Pointing-Pointer Conductive-AFM was used to modify the surface of GeSbTe thin film. - Abstract: GeSbTe (GST) thin films were deposited on quartz substrates using electron beam evaporation system and then annealed in nitrogen atmosphere at different temperatures, ranging from 20 Degree-Sign C to 300 Degree-Sign C. X-ray diffraction (XRD) and Atomic Force microscope (AFM) measurements were used to characterize the as-deposited and post-annealed thin films. Annealing treatment was found to induce changes on microstructure, surface roughness and grain size, indicating that with the increase of annealing temperature, the amorphous GST films first changed to face-centered-cubic (fcc) phase and then the stable hexagonal (hex) phase. Meanwhile, conductive-AFM (C-AFM) was used to produce crystallized GST dots on thin films. I-V spectroscopy results show that GST films can switch from amorphous state to crystalline state at threshold voltage. After switching, I-V curve exhibits ohmic characteristic, which is usually observed in crystallized GST films. By applying repeated I-V spectroscopies on the thin films, crystallized nuclei were observed. As the times of I-V spectroscopies increases, the area of written dots increases, and the center of the mark begin to ablate. The AFM images show that the shape of marks is an ablated center with a raised ring surrounding it.

  6. Atomic Force Microscope nanolithography on chromosomes to generate single-cell genetic probes

    Directory of Open Access Journals (Sweden)

    Valle Francesco

    2011-06-01

    Full Text Available Abstract Background Chromosomal dissection provides a direct advance for isolating DNA from cytogenetically recognizable region to generate genetic probes for fluorescence in situ hybridization, a technique that became very common in cyto and molecular genetics research and diagnostics. Several reports describing microdissection methods (glass needle or a laser beam to obtain specific probes from metaphase chromosomes are available. Several limitations are imposed by the traditional methods of dissection as the need for a large number of chromosomes for the production of a probe. In addition, the conventional methods are not suitable for single chromosome analysis, because of the relatively big size of the microneedles. Consequently new dissection techniques are essential for advanced research on chromosomes at the nanoscale level. Results We report the use of Atomic Force Microscope (AFM as a tool for nanomanipulation of single chromosomes to generate individual cell specific genetic probes. Besides new methods towards a better nanodissection, this work is focused on the combination of molecular and nanomanipulation techniques which enable both nanodissection and amplification of chromosomal and chromatidic DNA. Cross-sectional analysis of the dissected chromosomes reveals 20 nm and 40 nm deep cuts. Isolated single chromosomal regions can be directly amplified and labeled by the Degenerate Oligonucleotide-Primed Polymerase Chain Reaction (DOP-PCR and subsequently hybridized to chromosomes and interphasic nuclei. Conclusions Atomic force microscope can be easily used to visualize and to manipulate biological material with high resolution and accuracy. The fluorescence in situ hybridization (FISH performed with the DOP-PCR products as test probes has been tested succesfully in avian microchromosomes and interphasic nuclei. Chromosome nanolithography, with a resolution beyond the resolution limit of light microscopy, could be useful to the

  7. Characterizing the free and surface-coupled vibrations of heated-tip atomic force microscope cantilevers.

    Science.gov (United States)

    Killgore, Jason P; Tung, Ryan C; Hurley, Donna C

    2014-08-29

    Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties, such as contact resonance force microscopy, creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an atomic force microscope cantilever's vibrational modes, it is essential to understand how the vibrations of the U-shaped HT-AFM cantilever differ from those of a more traditional rectangular lever, for which analytical techniques are better developed. Here we show, with a combination of finite element analysis (FEA) and experiments, that the HT-AFM cantilever exhibits many more readily-excited vibrational modes over typical AFM frequencies compared to a rectangular cantilever. The arms of U-shaped HT-AFM cantilevers exhibit two distinct forms of flexural vibrations that differ depending on whether the two arms are vibrating in-phase or out-of-phase with one another. The in-phase vibrations are qualitatively similar to flexural vibrations in rectangular cantilevers and generally show larger sensitivity to surface stiffness changes than the out-of-phase vibrations. Vibration types can be identified from their frequency and by considering vibration amplitudes in the horizontal and vertical channels of the AFM at different laser spot positions on the cantilever. For identifying contact resonance vibrational modes, we also consider the sensitivity of the resonant frequencies to a change in applied force and hence to tip-sample contact stiffness. Finally, we assess how existing analytical models can be used to accurately predict contact stiffness from contact-resonance HT-AFM results. A simple two-parameter Euler-Bernoulli beam model provided good agreement with FEA for in-phase modes up to a contact stiffness 500 times the cantilever spring constant. By providing insight into cantilever vibrations and exploring the potential of current analysis techniques, our results lay the groundwork

  8. Alcoholic liver injury: defenestration in noncirrhotic livers--a scanning electron microscopic study

    DEFF Research Database (Denmark)

    Horn, T; Christoffersen, P; Henriksen, Jens Henrik Sahl

    1987-01-01

    (fractional area of fenestrae) was observed in acinar Zone 3, both in biopsies with and without Zone 3 fibrosis as judged by light microscopy. A significant reduction of porosity as shown in this study may influence the blood hepatocytic exchange and contribute to the alcohol-induced liver injury.......The fenestration of hepatic sinusoidal endothelial cells in 15 needle biopsies obtained from chronic alcoholics without cirrhosis was studied by scanning electron microscopy. As compared to nonalcoholics, a significant reduction in the number of fenestrae and porosity of the sinusoidal lining wall...

  9. A scanning electron microscopic study of impala (Aepyceros melampus sperm from the Kruger National Park

    Directory of Open Access Journals (Sweden)

    D.J. Ackerman

    1996-02-01

    Full Text Available Since knowledge of sperm morphological characteristics can play an important role in semen evaluation and fertilisation, baseline data on sperm ultrastructure are required. Live spermatozoa were collected from the cauda epididymis from 64 impala rams in the Kruger National Park and 5082 spermatozoa from 40 of these impala were studied by scanning electron microscopy. The mean length of impala sperm was 59.23 @ 2.7 um. The morphology of normal sperm as well as the occurrence of abnormalities were documented. The morphology of impala sperm were compared with those of other mammals. New findings on appendages of the cytoplasmic droplet are described and interpreted.

  10. Scanning electron microscopic analyses of Ferrocyanide tank wastes for the Ferrocyanide safety program

    Energy Technology Data Exchange (ETDEWEB)

    Callaway, W.S.

    1995-09-01

    This is Fiscal Year 1995 Annual Report on the progress of activities relating to the application of scanning electron microscopy in addressing the Ferrocyanide Safety Issue associated with Hanford Site high-level radioactive waste tanks. The status of the FY 1995 activities directed towards establishing facilities capable of providing SEM based micro-characterization of ferrocyanide tank wastes is described. A summary of key events in the SEM task over FY 1995 and target activities in FY 1996 are presented. A brief overview of the potential applications of computer controlled SEM analytical data in light of analyses of ferrocyanide simulants performed by an independent contractor is also presented

  11. First-principles theory of inelastic currents in a scanning tunneling microscope

    DEFF Research Database (Denmark)

    Stokbro, Kurt; Hu, Ben Yu-Kuang; Thirstrup, C.

    1998-01-01

    A first-principles theory of inelastic tunneling between a model probe tip and an atom adsorbed on a surface is presented, extending the elastic tunneling theory of Tersoff and Hamann. The inelastic current is proportional to the change in the local density of states at the center of the tip due...... to the addition of the adsorbate. We use the theory to investigate the vibrational heating of an adsorbate below a scanning tunneling microscopy tip. We calculate the desorption rate of PI from Si(100)-H(2 X 1) as a function of the sample bias and tunnel current, and find excellent a,agreement with recent...

  12. Scanning electron microscopic study of hamster tracheal organ cultures infected with Bordetella pertussis.

    Science.gov (United States)

    Muse, K E; Collier, A M; Baseman, J B

    1977-12-01

    Hamster tracheal organculture was employed as a model for the study of the pathogenesis of infection due to bordetella pertusis. Scanning electron microscopy provided a three-dimensional view of the surface infection of the tracheal explants. Phase I B. pertussis attached only to the ciliated epithelial cells, and a sequence of events involving the injury, expulsion, and destruction of these differentiated cells occurred. This in vitro model provides insights into the mechanisms by which B. pertussis mediates host cell injury at the site of infection.

  13. Development of electron optical system using annular pupils for scanning transmission electron microscope by focused ion beam

    Energy Technology Data Exchange (ETDEWEB)

    Matsutani, Takaomi, E-mail: matutani@ele.kindai.ac.jp [Kinki University, 3-4-1 Kowakae, Higashiosaka, Osaka 577-8502 (Japan); Yasumoto, Tsuchika; Tanaka, Takeo [Osaka Sangyo University, 3-1-1 Nakagaito, Daito, Osaka 574-8530 (Japan); Kawasaki, Tadahiro; Ichihashi, Mikio [Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603 (Japan); Ikuta, Takashi [Osaka Electro-Communication University, 18-8 Hatsu-cho, Neyagawa, Osaka 572-8530 (Japan)

    2012-02-01

    Annular pupils for electron optics were produced using a focused ion beam (FIB), enabling an increase in the depth of focus and allowing for aberration-free imaging and separation of the amplitude and phase images in a scanning transmission electron microscope (STEM). Simulations demonstrate that an increased focal depth is advantageous for three-dimensional tomography in the STEM. For a 200 kV electron beam, the focal depth is increased to approximately 100 nm by using an annular pupil with inner and outer semi-angles of 29 and 30 mrad, respectively. Annular pupils were designed with various outer diameters of 40-120 {mu}m and the inner diameter was designed at 80% of the outer diameter. A taper angle varying from 1 Degree-Sign to 20 Degree-Sign was applied to the slits of the annular pupils to suppress the influence of high-energy electron scattering. The fabricated annular pupils were inspected by scanning ion beam microscopy and scanning electron microscopy. These annular pupils were loaded into a STEM and no charge-up effects were observed in the scintillator projection images recorded by a CCD camera.

  14. Epithelial maturation pattern of dysplastic epithelium and normal oral epithelium exposed to tobacco and alcohol: a scanning electron microscopic study.

    Science.gov (United States)

    Jagannathan, Nithya; Ramani, Pratibha; Premkumar, Priya; Natesan, Anuja; Sherlin, Herald J

    2013-05-01

    The detection of oral cancer at an early stage is an optimal strategy and is the most effective approach for preventing further progression. The rationale of the study was to evaluate the epithelial maturation pattern in oral mucosa exposed to tobacco/alcohol and on dysplastic oral mucosa using the scanning electron microscope. Fifteen subjects were selected based on clinical examination and divided into three groups: group 1-patients with apparently normal oral mucosa; group 2-patients with oral mucosa exposed to tobacco/alcohol; group 3-patients with clinical diagnosis of leukoplakia. An incisional biopsy was performed from the buccal mucosa. One part of the specimen was prepared for light microscopy and the other part was prepared for scanning electron microscopy. Light microscopy revealed nonkeratinized stratified squamous epithelium in group 1, while group 2 demonstrated hyperparakeratinized stratified squamous epithelium with mild cytological atypia, and group 3 showed architectural and cytological changes. Scanning electron microscopy demonstrated flat-surfaced cells with equidistant parallel microridges in group 1, while group 2 showed irregular and widened microridges with numerous pits and absence of honeycomb pattern. Group 3 showed irregularly arranged broad and swollen cells with numerous pits and irregular microvilli projecting over the surface. The present study establishes the relationship of the surface abnormalities to the tendency of the cells to become malignant and thus serves as a tool in early detection of squamous cell carcinoma. It also emphasizes the need of routine follow-up in these high-risk patients for progression of carcinoma.

  15. Marginal Leakage of Class V Composite Restorations Assessed Using Microcomputed Tomography and Scanning Electron Microscope.

    Science.gov (United States)

    Rengo, C; Goracci, C; Ametrano, G; Chieffi, N; Spagnuolo, G; Rengo, S; Ferrari, M

    2015-01-01

    The aim of the study was to compare in Class V composite restorations marginal leakage measurements obtained with microcomputed tomography (micro-CT) and scanning electron microscopy (SEM) observations. Class V cavities were prepared on 10 human molars and restored using Optibond FL (Kerr, Orange, CA, USA) and Premise Flowable (Kerr). Sealing ability was evaluated by assessing silver-nitrate penetration depth along enamel and dentin margins. Leakage was quantified using a scoring system. Micro-CT analysis provided 502 cross-sectional images for each tooth. Microleakage evaluation was performed first on three cross-sections corresponding to the sections examined by SEM, then on all 502 of the obtained micro-CT images. SEM observations were performed first at 20× magnification, then, if showing a zero score, at 80× magnification. Enamel and dentin microleakage scores assigned to corresponding sections through micro-CT and SEM (20×) were compared (Wilcoxon signed-rank test, α=0.05). No statistically significant difference in leakage scores emerged between micro-CT and 20×-magnification SEM. Eight tooth sections that were given a zero score under SEM at 20× magnification showed to be infiltrated at the higher magnification (80×). For five teeth a higher score was assigned following scanning of 502 cross-sections than based on the observation of three sections. Micro-CT presents as a valid, nondestructive in vitro method to quantitatively evaluate marginal leakage of adhesive restorations.

  16. Signal of microstrip scanning near-field optical microscope in far- and near-field zones.

    Science.gov (United States)

    Morozov, Yevhenii M; Lapchuk, Anatoliy S

    2016-05-01

    An analytical model of interference between an electromagnetic field of fundamental quasi-TM(EH)00-mode and an electromagnetic field of background radiation at the apex of a near-field probe based on an optical plasmon microstrip line (microstrip probe) has been proposed. The condition of the occurrence of electromagnetic energy reverse flux at the apex of the microstrip probe was obtained. It has been shown that the nature of the interference depends on the length of the probe. Numerical simulation of the sample scanning process was conducted in illumination-reflection and illumination-collection modes. Results of numerical simulation have shown that interference affects the scanning signal in both modes. However, in illumination-collection mode (pure near-field mode), the signal shape and its polarity are practically insensible to probe length change; only signal amplitude (contrast) is slightly changed. However, changing the probe length strongly affects the signal amplitude and shape in the illumination-reflection mode (the signal formed in the far-field zone). Thus, we can conclude that even small background radiation can significantly influence the signal in the far-field zone and has practically no influence on a pure near-field signal.

  17. Atomic Imaging Using Secondary Electrons in a Scanning Transmission Electron Microscope: Experimental Observations and Possible Mechanisms

    Energy Technology Data Exchange (ETDEWEB)

    Su, D.; Inada, H.; Egerton, R.F.; Konno, M.; Wua, L.; Ciston, J.; Wall, J.; Zhu, Y.

    2011-11-11

    We report detailed investigation of high-resolution imaging using secondaryelectrons (SE) with a sub-nanometer probe in an aberration-corrected transmissionelectron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. Apossiblemechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization.

  18. Evaluation of the presence of Enterococcus Faecalis in root cementum: A confocal laser scanning microscope analysis.

    Science.gov (United States)

    Halkai, Rahul; Hegde, Mithra N; Halkai, Kiran

    2014-03-01

    The aim of this study is to address the cause of persistent infection of root cementum by Enterococcus faecalis. A sample of 60 human single-rooted teeth were divided into three groups. Group I (control group) had no access opening and one-third of the apical root cementum was sealed using varnish. Group II had no preparation of teeth samples. In group III, apical root cementum was exposed to organic acid and roughened using diamond point to mimic apical resorption. After access opening in groups II and III, all teeth samples were sterilized using gamma irradiation (25 kGy). E. faecalis broth was placed in the root canal and apical one-third of the tooth was immersed in the broth for 8 weeks with alternate day refreshment followed by biomechanical preparation, obturation and coronal seal. Apical one-third of all teeth samples were again immersed in the broth for 8 weeks with alternate day refreshment to mimic secondary infection. The samples were observed under a confocal microscope after splitting the teeth into two halves. E. faecalis penetrated 160 μm deep into the root cementum in group III samples and only showed adhesion in group II samples. Penetration and survival of E. faecalis deep inside the cementum in extreme conditions could be the reason for persistent infection.

  19. Detection of circulating tumour cells in peripheral blood with an automated scanning fluorescence microscope.

    Science.gov (United States)

    Ntouroupi, T G; Ashraf, S Q; McGregor, S B; Turney, B W; Seppo, A; Kim, Y; Wang, X; Kilpatrick, M W; Tsipouras, P; Tafas, T; Bodmer, W F

    2008-09-02

    We have developed an automated, highly sensitive and specific method for identifying and enumerating circulating tumour cells (CTCs) in the blood. Blood samples from 10 prostate, 25 colorectal and 4 ovarian cancer patients were analysed. Eleven healthy donors and seven men with elevated serum prostate-specific antigen (PSA) levels but no evidence of malignancy served as controls. Spiking experiments with cancer cell lines were performed to estimate recovery yield. Isolation was performed either by density gradient centrifugation or by filtration, and the CTCs were labelled with monoclonal antibodies against cytokeratins 7/8 and either AUA1 (against EpCam) or anti-PSA. The slides were analysed with the Ikoniscope robotic fluorescence microscope imaging system. Spiking experiments showed that less than one epithelial cell per millilitre of blood could be detected, and that fluorescence in situ hybridisation (FISH) could identify chromosomal abnormalities in these cells. No positive cells were detected in the 11 healthy control samples. Circulating tumour cells were detected in 23 out of 25 colorectal, 10 out of 10 prostate and 4 out of 4 ovarian cancer patients. Five samples (three colorectal and two ovarian) were analysed by FISH for chromosomes 7 and 8 combined and all had significantly more than four dots per cell. We have demonstrated an Ikoniscope based relatively simple and rapid procedure for the clear-cut identification of CTCs. The method has considerable promise for screening, early detection of recurrence and evaluation of treatment response for a wide variety of carcinomas.

  20. Calibration of an interfacial force microscope for MEMS metrology : FY08-09 activities.

    Energy Technology Data Exchange (ETDEWEB)

    Houston, Jack E.; Baker, Michael Sean; Crowson, Douglas A.; Mitchell, John Anthony; Moore, Nathan W.

    2009-10-01

    Progress in MEMS fabrication has enabled a wide variety of force and displacement sensing devices to be constructed. One device under intense development at Sandia is a passive shock switch, described elsewhere (Mitchell 2008). A goal of all MEMS devices, including the shock switch, is to achieve a high degree of reliability. This, in turn, requires systematic methods for validating device performance during each iteration of design. Once a design is finalized, suitable tools are needed to provide quality assurance for manufactured devices. To ensure device performance, measurements on these devices must be traceable to NIST standards. In addition, accurate metrology of MEMS components is needed to validate mechanical models that are used to design devices to accelerate development and meet emerging needs. Progress towards a NIST-traceable calibration method is described for a next-generation, 2D Interfacial Force Microscope (IFM) for applications in MEMS metrology and qualification. Discussed are the results of screening several suitable calibration methods and the known sources of uncertainty in each method.

  1. Determination of the Elastic Properties of Tomato Fruit Cells with an Atomic Force Microscope

    Directory of Open Access Journals (Sweden)

    Andrzej Kurenda

    2013-09-01

    Full Text Available Since the mechanical properties of single cells together with the intercellular adhesive properties determine the macro-mechanical properties of plants, a method for evaluation of the cell elastic properties is needed to help explanation of the behavior of fruits and vegetables in handling and food processing. For this purpose, indentation of tomato mesocarp cells with an atomic force microscope was used. The Young’s modulus of a cell using the Hertz and Sneddon models, and stiffness were calculated from force-indentation curves. Use of two probes of distinct radius of curvature (20 nm and 10,000 nm showed that the measured elastic properties were significantly affected by tip geometry. The Young’s modulus was about 100 kPa ± 35 kPa and 20 kPa ± 14 kPa for the sharper tip and a bead tip, respectively. Moreover, large variability regarding elastic properties (>100% among cells sampled from the same region in the fruit was observed. We showed that AFM provides the possibility of combining nano-mechanical properties with topography imaging, which could be very useful for the study of structure-related properties of fruits and vegetables at the cellular and sub-cellular scale.

  2. Simultaneous topography imaging and broadband nanomechanical mapping on atomic force microscope

    Science.gov (United States)

    Li, Tianwei; Zou, Qingze

    2017-12-01

    In this paper, an approach is proposed to achieve simultaneous imaging and broadband nanomechanical mapping of soft materials in air by using an atomic force microscope. Simultaneous imaging and nanomechanical mapping are needed, for example, to correlate the morphological and mechanical evolutions of the sample during dynamic phenomena such as the cell endocytosis process. Current techniques for nanomechanical mapping, however, are only capable of capturing static elasticity of the material, or the material viscoelasticity in a narrow frequency band around the resonant frequency(ies) of the cantilever used, not competent for broadband nanomechanical mapping, nor acquiring topography image of the sample simultaneously. These limitations are addressed in this work by enabling the augmentation of an excitation force stimuli of rich frequency spectrum for nanomechanical mapping in the imaging process. Kalman-filtering technique is exploited to decouple and split the mixed signals for imaging and mapping, respectively. Then the sample indentation generated is quantified online via a system-inversion method, and the effects of the indentation generated and the topography tracking error on the topography quantification are taken into account. Moreover, a data-driven feedforward-feedback control is utilized to track the sample topography. The proposed approach is illustrated through experimental implementation on a polydimethylsiloxane sample with a pre-fabricated pattern.

  3. Comparison of line width calibration using critical dimension atomic force microscopes between PTB and NIST

    Science.gov (United States)

    Dai, Gaoliang; Hahm, Kai; Bosse, Harald; Dixson, Ronald G.

    2017-06-01

    International comparisons between National Metrology Institutes are important to verify measurement results and the associated uncertainties. In this paper, we report a comparison of the line width calibration of a crystalline silicon line width standard, referred to as IVPS100-PTB standard, between the Physikalisch-Technische Bundesanstalt in Germany and the National Institute of Standards and Technology in the United States. Critical dimension atomic force microscopy was the measurement method used for this comparison. Both institutes applied generally the same but independently developed traceability pathways: the scaling factor of the atomic force microscope (AFM) scanner was calibrated by a set of step height and lateral standards certified by metrological AFMs, while the effective tip width was ultimately traceable to the lattice parameter of silicon via high resolution transmission electron microscopy. Good agreement has been achieved in the comparison: For two groups of line features with nominal critical dimensions (CDs) of 50 nm, 70 nm, 90 nm, 110 nm and 130 nm that were compared, the observed deviations of CD results were between  -1.5 nm and 0.3 nm. The deviations are well within the associated measurement uncertainty.

  4. Practical aspects of single-pass scan Kelvin probe force microscopy

    Science.gov (United States)

    Li, Guangyong; Mao, Bin; Lan, Fei; Liu, Liming

    2012-11-01

    The single-pass scan Kelvin probe force microscopy (KPFM) in ambient condition has a few advantages over the dual-pass lift-up scan KPFM. For example, its spatial resolution is expected to be higher; and its topographical errors caused by electrostatic forces are minimized because electrostatic forces are actively suppressed during the simultaneous topographical and KPFM measurement. Because single-pass scan KPFM in ambient condition is relatively new, it received little attention in the literature so far. In this article, we discuss several major practical aspects of single-pass scan KPFM especially in ambient condition. First, we define the resolution using a point spread function. With this definition, we analyze the relation between the resolution and the scanning parameters such as tip apex radius and tip-surface distance. We further study the accuracy of KPFM based on the point spread function. Then, we analyze the sensitivity of KPFM under different operation modes. Finally, we investigate the crosstalk between the topographical image and the surface potential image and demonstrate the practical ways to minimize the crosstalk. These discussions not only help us to understand the single-pass scan KPFM but also provide practical guidance in using single-pass scan KPFM.

  5. The low-temperature method for study of coniferous tissues in the environmental scanning electron microscope.

    Science.gov (United States)

    Neděla, Vilém; Tihlaříková, Eva; Hřib, Jiří

    2015-01-01

    The use of non-standard low-temperature conditions in environmental scanning electron microscopy might be promising for the observation of coniferous tissues in their native state. This study is aimed to analyse and evaluate the method based on the principle of low-temperature sample stabilization. We demonstrate that the upper mucous layer is sublimed and a microstructure of the sample surface can be observed with higher resolution at lower gas pressure conditions, thanks to a low-temperature method. An influence of the low-temperature method on sample stability was also studied. The results indicate that high-moisture conditions are not suitable for this method and often cause the collapse of samples. The potential improvement of stability to beam damage has been demonstrated by long-time observation at different operation parameters. We finally show high applicability of the low-temperature method on different types of conifers and Oxalis acetosella. © 2014 Wiley Periodicals, Inc.

  6. Design and performance of a compact scanning transmission X-ray microscope at the Photon Factory

    Energy Technology Data Exchange (ETDEWEB)

    Takeichi, Y., E-mail: yasuo.takeichi@kek.jp; Mase, K.; Ono, K. [Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba 305-0801 (Japan); Department of Materials Structure Science, SOKENDAI (The Graduate University for Advanced Studies), 1-1 Oho, Tsukuba 305-0801 (Japan); Inami, N. [Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba 305-0801 (Japan); Suga, H. [Department of Earth and Planetary Systems Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Miyamoto, C. [Department of Earth and Planetary Systems Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku 113-0033 (Japan); Ueno, T. [National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047 (Japan); Takahashi, Y. [Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba 305-0801 (Japan); Department of Earth and Planetary Systems Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan); Department of Earth and Planetary Systems Science, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku 113-0033 (Japan)

    2016-01-15

    We present a new compact instrument designed for scanning transmission X-ray microscopy. It has piezo-driven linear stages, making it small and light. Optical components from the virtual source point to the detector are located on a single optical table, resulting in a portable instrument that can be operated at a general-purpose spectroscopy beamline without requiring any major reconstruction. Careful consideration has been given to solving the vibration problem common to high-resolution microscopy, so as not to affect the spatial resolution determined by the Fresnel zone plate. Results on bacteriogenic iron oxides, single particle aerosols, and rare-earth permanent magnets are presented as examples of its performance under diverse applications.

  7. A comparative scanning electron microscopic view of the integument of domestic mammals.

    Science.gov (United States)

    Meyer, W; Neurand, K

    1987-03-01

    Scanning electron microscopy (SEM) demonstrates efficiently species-specific differences of hairy skin (integumentum commune) of domestic mammals (pig, cat, dog, horse, cattle, sheep, goat). This technique is very helpful in characterizing the typical structural features of the epidermal layers, the arrangement of the collagen fibre bundles and the elastic fibre network in the dermis, the external and internal construction of hair follicles and hair shafts, and the functional development of skin glands. It is also possible to observe certain domestication effects, especially where the hair coat is concerned. SEM supplements the knowledge about the integument as available from conventional transmission electron microscopy, light microscopy or histochemistry. Thus, comparative morphology can be the basis for the development of specific functional models of the different integumentary layers and derivatives or their tissues involved.

  8. A morphological study of molecularly imprinted polymers using the scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Paniagua Gonzalez, Gema [Departamento de Ciencias Analiticas, Facultad de Ciencias, Universidad Nacional de Educacion a Distancia (UNED), 28040 Madrid (Spain)]. E-mail: gpaniagua@pas.uned.es; Fernandez Hernando, Pilar [Departamento de Ciencias Analiticas, Facultad de Ciencias, Universidad Nacional de Educacion a Distancia (UNED), 28040 Madrid (Spain); Durand Alegria, J.S. [Departamento de Ciencias Analiticas, Facultad de Ciencias, Universidad Nacional de Educacion a Distancia (UNED), 28040 Madrid (Spain)

    2006-01-31

    Molecular imprinting is an emerging technique for producing polymers with applications in affinity-based separation, in biomimetic sensors, in catalysis, etc. This variety of uses relies upon the production of polymers with different affinities, specificities, sensitivities and loading capacities. Research into the development of molecular imprinted polymers (MIPs) with new or improved morphologies - which involves modification of the polymerisation process - is therefore underway. This paper reports a comparative study of non-covalent MIPs synthesised by 'bulk' polymerisation using digoxin as template. These were synthesised under different conditions, i.e., changing the functional monomers employed (methacrylic acid or 2-vinylpyridine), the porogens (acetonitrile or dichloromethane) used, and by altering the volume of the latter. The polymerisation process was allowed to proceed either under UV light or in a thermostat-controlled waterbath. The surface morphology (was determined by scanning electron microscopy) and the ability of the different polymers to selectively rebind the template was then evaluated.

  9. [Scanning electron microscopic study of films of the loose connective tissue of mice exposed to DMBA].

    Science.gov (United States)

    Ol'shevskaia, L V

    1979-01-01

    Under examination by scanning electron microscopy were film samples of the subcutaneous connective tissue. The surface of the films from intact mice was even and smooth, fibroblasts have a spread pattern. Following the saline injection the film was even, collagen fibres, differing in the character of surface and the size of diameter, were readily seen. The collagen fibres formed a multilayer system with a definite orientation inside the layer. After DMBA injection the film surface would get uneven and tuberous, the fibroblast body rising over the film surface, thus the orientation of fibres and all strata was disturbed. There was a spacial rearrangement of all tissue components. It is suggested that carcinogenic agents affecting the relationship between tissue components could interfere the contact inhibition of cell division and result in the development of focal cell proliferates.

  10. Theoretical analysis of a dual-probe scanning tunneling microscope setup on graphene

    DEFF Research Database (Denmark)

    Settnes, Mikkel; Power, Stephen R.; Petersen, Dirch Hjorth

    2014-01-01

    Experimental advances allow for the inclusion of multiple probes to measure the transport properties of a sample surface. We develop a theory of dual-probe scanning tunneling microscopy using a Green's function formalism, and apply it to graphene. Sampling the local conduction properties at finite...... length scales yields real space conductance maps which show anisotropy for pristine graphene systems and quantum interference effects in the presence of isolated impurities. Spectral signatures in the Fourier transforms of real space conductance maps include characteristics that can be related...... to different scattering processes. We compute the conductance maps of graphene systems with different edge geometries or height fluctuations to determine the effects of nonideal graphene samples on dual-probe measurements. © 2014 American Physical Society....

  11. Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Yoshino, Tomoyuki; Sugiyama, Shigeru; Hagiwara, Shoji; Fukushi, Daisuke; Shichiri, Motoharu; Nakao, Hidenobu; Kim, J.-M.; Hirose, Tamaki; Muramatsu, Hiroshi; Ohtani, Toshio

    2003-10-15

    Nano-scale structures of the YOYO-1-stained barley chromosomes and lambda-phage DNA were investigated by scanning near-field optical/atomic force microscopy (SNOM/AFM). This technique enabled precise analysis of fluorescence structural images in relation to the morphology of the biomaterials. The results suggested that the fluorescence intensity does not always correspond to topographic height of the chromosomes, but roughly reflects the local amount and/or density of DNA. Various sizes of the bright fluorescence spots were clearly observed in fluorescence banding-treated chromosomes. Furthermore, fluorescence-stained lambda-phage DNA analysis by SNOM/AFM demonstrated the possibility of nanometer-scale imaging for a novel technique termed nano-fluorescence in situ hybridization (nano-FISH). Thus, SNOM/AFM is a powerful tool for analyzing the structure and the function of biomaterials with higher resolution than conventional optical microscopes.

  12. The micromorphology of the blesbuck louse Damalinia (Damalinia crenelata as observed under the scanning electron microscope

    Directory of Open Access Journals (Sweden)

    M.L. Turner

    2003-12-01

    Full Text Available The blesbuck is an important game animal on many game farms and reserves in South Africa. Damalinia crenelata, a biting louse, host-specific to the blesbuck, feed upon epidermal debris of this antelope, leading to severe skin irritation and dermatitis. Symptomatic scratching by the host aggravates these conditions. High infestations may lead to decreased population numbers. Live lice were collected from a blesbuck in the Rietvlei Nature Reserve and prepared for selectron microscopic investigation. Micrographs were recorded. The SEM investigation revealed several micromorphological features not previously described in D. crenelata. Besides the obvious anatomical differences in the reproductive organs of the male and female, several other differences were noted. The antennal flagellae showed morphological differences as well as certain features on the ventral surfaces of the head. Dorsally the forehead was markedly emarginated and showed an acute invagination (clypeo labral suture in the pulvinal area. The ventral surface of the head clearly demonstrated the structures of the preantennal regions such as ventral carina, pulvinus, labrum, mandibles and clypeus. The epipharynx appeared as an underlying extension of the labrum. The rims of the clypeus were more raised and thickened in the female than in that of the male. The mandibles were not notched and were noted to be angular in shape. The three segments of each of the antennae of the male were thicker and more robust than than those of the female. This could suggest sexual dimorphism in this species. The sensilla basoconica comprised 10 pegs. Pit organs were seen within the pore organs. The prothorax and mesothorax were clearly distinguished. The abdominal segments showed six pairs of spiracles. The male andfemale terminalia were confirmed to be strongly sexually dimorphic. The three pairs oflegs each terminated in a single, long and slender, claw.

  13. Fundamental and experimental aspects of diffraction for characterizing dislocations by electron channeling contrast imaging in scanning electron microscope.

    Science.gov (United States)

    Kriaa, H; Guitton, A; Maloufi, N

    2017-08-29

    Nowadays Field Emission Gun-Scanning Electron Microscopes provide detailed crystallographic information with high spatial and angular resolutions, and allow direct observation of crystalline defects, such as dislocations, through an attractive technique called Electron Channeling Contrast Imaging (ECCI). Dislocations play a crucial role in the properties of materials and ECCI has naturally emerged as an adapted tool for characterizing defects in bulk specimen. Nevertheless, fine control of the channeling conditions is absolutely required to get strong dislocation contrast for achieving comprehensive analysis. In this work, experiment-assisted fundamental aspects of the origin of dislocation contrast are studied. Experimentally, the potential of ECCI is explored in several dislocation configurations in Interstitial-Free steel (Fe - 1% Si) used as a model material. Full interpretations of dislocation contrast in (g, -g) and its evolution along the Kikuchi band are shown. Furthermore, a dislocation dipole is observed and fully characterized for the first time in an SEM.

  14. Project NANO: Will allowing high school students to use research grade scanning electron microscopes increase their interest in science?

    Science.gov (United States)

    Smith, Leslie TenEyck

    In this study, one AP Biology curriculum unit and one general Biology curriculum unit that included tabletop Scanning Electron Microscope (SEM) technology provided by Project NANO, a grant-funded, collaborative initiative designed to integrate cutting-edge nanotechnology into high school classrooms were implemented at a public high school in rural Oregon. Nine students participated in the AP unit and 52 students participated in the general Biology unit. Each student completed an opinion-based pre and post survey to determine if using the SEM as a part of the curriculum unit had an impact on his or her interest in science or in nanoscience. Interviews were conducted to add to the data. The results indicate that using the SEM can increase a student's interest in science. Recommendations for improving student experience were identified.

  15. Light and scanning electron microscopic studies on the esophageal spines in the Pacific ridley turtle, Lepidochelys olivacea.

    Science.gov (United States)

    Yoshie, S; Honma, Y

    1976-02-01

    The peculairly specialized esophagus of the Pacific ridley turtle, Lepidochelys olivacea, was described by light and scanning electron microscopic studies. The esophagus is lined by a stratified squamous epithelium with remarkable keratinization, and its major part forms a number of large spines which have been called "pharyngeal teeth." The epithelium consists of three strate: stratum germinativum, stratum spinosum and stratum corneum. The surface of the spine is covered by a scaly keratin of possibly sloughing cells, and the cornified layer on the spine is very thick (more than 100 mu), reaching 3 to 7 times the depth of the corresponding layer in other parts. This peculiar structure in the marine turtle without toothed jaws prabably is used for breaking food into small pieces.

  16. Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope

    Science.gov (United States)

    Wu, J.S.; Kim, A. M.; Bleher, R.; Myers, B.D.; Marvin, R. G.; Inada, H.; Nakamura, K.; Zhang, X.F.; Roth, E.; Li, S.Y.; Woodruff, T. K.; O'Halloran, T. V.; Dravid, Vinayak P.

    2013-01-01

    A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room- and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems. PMID:23500508

  17. Morphological confocal laser scanning microscope evaluation of four different "etch and rinse" adhesives in post endodontic restoration.

    Science.gov (United States)

    Marigo, Luca; Lajolo, Carlo; Castagnola, Raffaella; Angerame, Daniele; Somma, Francesco

    2012-01-01

    The aim of this study was to perform a morphometric evaluation of the resin-root canal dentine interface of four "etch and rinse" adhesive systems. Forty human teeth were restored through a fiber post insertion using: Group 1: XP Bond adhesive; Group 2: Prime & Bond NT; Group 3: Surgi Prime Bond adhesive; Group 4: Scotchbond Multi-Purpose Plus. Two cross-sections (apical and coronal) were obtained and analyzed in morphological confocal laser scanning microscope. The numbers of resin tags (RT) and the thickness of the hybrid layer (HL) were evaluated. Quantitative variables were tested by a Shapiro-Wilk test. Parametric variables by an Anova test. Group 4 produced the thickest HL and Group 1 showed the thinnest. Considering RT, Group 1 produced the highest density, while Group 3 the lowest density. All the adhesives produced good results in terms of HL thickness and RT density.

  18. Retrieving the Quantitative Chemical Information at Nanoscale from Scanning Electron Microscope Energy Dispersive X-ray Measurements by Machine Learning

    Science.gov (United States)

    Jany, B. R.; Janas, A.; Krok, F.

    2017-11-01

    The quantitative composition of metal alloy nanowires on InSb(001) semiconductor surface and gold nanostructures on germanium surface is determined by blind source separation (BSS) machine learning (ML) method using non negative matrix factorization (NMF) from energy dispersive X-ray spectroscopy (EDX) spectrum image maps measured in a scanning electron microscope (SEM). The BSS method blindly decomposes the collected EDX spectrum image into three source components, which correspond directly to the X-ray signals coming from the supported metal nanostructures, bulk semiconductor signal and carbon background. The recovered quantitative composition is validated by detailed Monte Carlo simulations and is confirmed by separate cross-sectional TEM EDX measurements of the nanostructures. This shows that SEM EDX measurements together with machine learning blind source separation processing could be successfully used for the nanostructures quantitative chemical composition determination.

  19. Coupling auto trophic in vitro plant cultivation system to scanning electron microscope to study plant-fungal interactions

    Energy Technology Data Exchange (ETDEWEB)

    Jaeger, N. de; Decock, C.; Declereck, S.; Providencia, I. E. de la

    2010-07-01

    The interactions of plants with pathogens and beneficial micro-organisms have been seldom compared on the same host and under strict controlled auto trophic in vitro culture conditions. Here, the life cycle of two plant beneficial (Glomus sp. MUCL 41833 and Trichoderma harzianum) and one plant pathogen (Rhizoctonia solani) fungi were described on potato (Solanum tuberosum) plantlets under auto trophic in vitro culture conditions using video camera imaging and the scanning electron microscope (SEM). (i) The colony developmental pattern of the extraradical mycelium within the substrate, (ii) the reproduction structures and (iii) the three-dimensional spatial arrangements of the fungal hyphae within the potato root cells were successfully visualized, monitored and described. The combination of the autotrophic in vitro culture system and SEM represent a powerful tool for improving our knowledge on the dynamics of plant-fungal interactions. (Author) 41 refs.

  20. Study of the surface structure of butterfly wings using the scanning electron microscopic moiré method.

    Science.gov (United States)

    Kishimoto, Satoshi; Wang, Qinghua; Xie, Huimin; Zhao, Yapu

    2007-10-01

    Scanning electron microscopic (SEM) moiré method was used to study the surface structure of three kinds of butterfly wings: Papilio maackii Menetries, Euploea midamus (Linnaeus), and Stichophthalma howqua (Westwood). Gratings composed of curves with different orientations were found on scales. The planar characteristics of gratings and some other planar features of the surface structure of these wings were revealed, respectively, in terms of virtual strain. Experimental results demonstrate that SEM moiré method is a simple, nonlocal, economical, effective technique for determining which grating exists on one whole scale, measuring the dimension and the whole planar structural character of the grating on each scale, as well as characterizing the relationship between gratings on different scales of each butterfly wing. Thus, the SEM moiré method is a useful tool to assist with characterizing the structure of butterfly wings and explaining their excellent properties.

  1. Effects of gamma radiation on hard dental tissues of albino rats using scanning electron microscope - Part 1

    Science.gov (United States)

    El-Faramawy, Nabil; Ameen, Reham; El-Haddad, Khaled; Maghraby, Ahmed; El-Zainy, Medhat

    2011-12-01

    In the present study, 40 adult male albino rats were used to study the effect of gamma radiation on the hard dental tissues (enamel surface, dentinal tubules and the cementum surface). The rats were irradiated at 0.2, 0.5, 1.0, 2.0, 4.0 and 6.0 Gy gamma doses. The effects of irradiated hard dental tissues samples were investigated using a scanning electron microscope. For doses up to 0.5 Gy, there was no evidence of the existence of cracks on the enamel surface. With 1 Gy irradiation dose, cracks were clearly observed with localized erosive areas. At 2 Gy irradiation dose, the enamel showed morphological alterations as disturbed prismatic and interprismatic areas. An increase in dentinal tubules diameter and a contemporary inter-tubular dentine volume decrease were observed with higher irradiation dose. Concerning cementum, low doses,teeth.

  2. High Quality Real-Time Video with Scanning Electron Microscope Using Total Variation Algorithm on a Graphics Processing Unit

    Science.gov (United States)

    Ouarti, Nizar; Sauvet, Bruno; Régnier, Stéphane

    2012-04-01

    The scanning electron microscope (SEM) is usually dedicated to taking a picture of micro-nanoscopic objects. In the present study, we wondered whether a SEM can be converted as a real-time video display. To this end, we designed a new methodology. We use the slow mode of the SEM to acquire a high quality reference image that can then be used to estimate the optimal parameters that regularize the signal for a given method. Here, we employ Total Variation, a method which minimizes the noise and regularizes the image. An optimal lagrangian multiplier can be computed that regularizes the image efficiently. We showed that a limited number of iterations for Total Variation algorithm can lead to an acceptable quality of regularization. This algorithm is parallel and deployed on a Graphics Processing Unit to obtain a real-time high quality video with a SEM. It opens the possibility of a real-time interaction at micro-nanoscales.

  3. In vitro validation of an ultra-sensitive scanning fluorescence microscope for analysis of Circulating Tumor Cells

    DEFF Research Database (Denmark)

    Hillig, Thore; Nygaard, Ann-Britt; Nekiunaite, Laura

    2014-01-01

    Analysis of circulating tumor cells (CTC) holds promise of providing liquid biopsies from patients with cancer. However, current methods include enrichment procedures. We present a method (CytoTrack), where CTC from 7.5 mL of blood is stained, analyzed and counted by a scanning fluorescence...... microscope. The method was validated by breast cancer cells (MCF-7) spiked in blood from healthy donors. The number of cells spiked in each blood sample was exactly determined by cell sorter and performed in three series of three samples spiked with 10, 33 or 100 cells in addition with three control samples...... for each series. The recovery rate of 10, 33 and 100 tumor cells in a blood sample was 55%, 70% and 78%, percent coefficient of variation (CV%) for samples was 59%, 32% and 18%, respectively. None of the control samples contained CTC. In conclusion, the method has been validated to highly sensitively...

  4. Transmission and scanning electron microscope study on the secondary cyclic hardening behavior of interstitial-free steel

    Energy Technology Data Exchange (ETDEWEB)

    Shih, Chia-Chang; Ho, New-Jin [Institute of Materials Science and Engineering, National Sun Yat-Sen University, Kaohsiung, Taiwan (China); Huang, Hsing-Lu, E-mail: hlhuang8423@gmail.com [Department of Mechanical Engineering, Chinese Military Academy, Kaohsiung, Taiwan (China)

    2009-11-15

    Strain controlled fatigue experiment was employed to evaluate automotive grade interstitial-free ferrite steel. Hundreds of grains were examined by scanning electron microscope under electron channeling contrast image technique of backscattered electron image mode for comprehensive comparison of micrographs with those taken under transmission electron microscope. The cyclic stress responses clearly revealed that rapid hardening occurs at the early stage of cycling as a result of multiplication of dislocations to develop loop patches, dipolar walls and dislocation cells at various total strain amplitudes. After primary rapid hardening, stress responses varied from being saturated to further hardening according to dislocation structure evolution at various strain amplitudes. The fatigue failure was always accompanied with further hardening including secondary hardening. The corresponding dislocation structures with the three types of hardening behaviors are discussed. Once the secondary hardening starts, dislocation cells began to develop along grain boundaries in the low strain region and then extended into grain interiors as strain amplitudes increased and cycling went on. The secondary hardening rates were found to be directly proportional to their strain amplitudes.

  5. Scanning electron microscope analysis of gunshot defects to bone: an underutilized source of information on ballistic trauma.

    Science.gov (United States)

    Rickman, John M; Smith, Martin J

    2014-11-01

    Recent years have seen increasing involvement by forensic anthropologists in the interpretation of skeletal trauma. With regard to ballistic injuries, there is now a large literature detailing gross features of such trauma; however, less attention has been given to microscopic characteristics. This article presents analysis of experimentally induced gunshot trauma in animal bone (Bos taurus scapulae) using full metal jacket (FMJ), soft point (SP), and captive bolt projectiles. The results were examined using scanning electron microscopy (SEM). Additional analysis was conducted on a purported parietal gunshot lesion in a human cranial specimen. A range of features was observed in these samples suggesting that fibrolamellar bone response to projectile impact is analogous to that observed in synthetic composite laminates. The results indicate that direction of bullet travel can be discerned microscopically even when it is ambiguous on gross examination. It was also possible to distinguish SP from FMJ lesions. SEM analysis is therefore recommended as a previously underexploited tool in the analysis of ballistic trauma. © 2014 American Academy of Forensic Sciences.

  6. Efficacy of 3 different irrigation systems on removal of calcium hydroxide from the root canal: a scanning electron microscopic study.

    Science.gov (United States)

    Alturaiki, Sami; Lamphon, Hebah; Edrees, Hadeel; Ahlquist, Michael

    2015-01-01

    The purpose of this study was to evaluate the effectiveness of different irrigation systems on removing calcium hydroxide (Ca[OH]2) from the root canal by using a scanning electron microscope. Forty extracted single-rooted teeth were divided randomly into 4 groups. Canal instrumentation was done, and the teeth were filled with Ca(OH)2 paste. One week later, 4 techniques were used for Ca(OH)2 removal. In the first group, the canals were cleaned with a master apical file. The second, third, and fourth groups were irrigated using the EndoVac (Discus Dental, Culver City, CA), EndoActivator (Dentsply Tulsa Dental Specialties, Tulsa, OK), and ProUltra (Dentsply Tulsa, Tulsa, OK) systems, respectively. All the groups were irrigated with 3 mL (18%) EDTA and 3 mL (1%) NaOCl for 1 minute. The canal walls were viewed, and the remaining amount of Ca(OH)2 was evaluated using a scanning electron microscope. A scoring system was used to assess the amount of residue Ca(OH)2 on each third of the canal. The obtained data for comparisons between the conventional irrigation needle and each device were statistically analyzed using the Mann-Whitney U test. To compare the 4 devices, the results were statistically analyzed using the analysis of variance test. None of the investigated techniques removed the Ca(OH)2 dressing completely. However, the EndoActivator System showed better results in removing Ca(OH)2 in each third of the root canals in comparison with the other techniques. Copyright © 2015 American Association of Endodontists. Published by Elsevier Inc. All rights reserved.

  7. Annular electron energy-loss spectroscopy in the scanning transmission electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Ruben, Gary [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Bosman, Michel [Institute of Materials Research and Engineering, A-STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602 (Singapore); D' Alfonso, Adrian J. [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia); Okunishi, Eiji; Kondo, Yukihito [JEOL Ltd., 1-2, Musashino 3-chome Akishima, Tokyo 196-8558 (Japan); Allen, Leslie J., E-mail: lja@unimelb.edu.au [School of Physics, University of Melbourne, Parkville, Victoria 3010 (Australia)

    2011-11-15

    We study atomic-resolution annular electron energy-loss spectroscopy (AEELS) in scanning transmission electron microscopy (STEM) imaging with experiments and numerical simulations. In this technique the central part of the bright field disk is blocked by a beam stop, forming an annular entry aperture to the spectrometer. The EELS signal thus arises only from electrons scattered inelastically to angles defined by the aperture. It will be shown that this method is more robust than conventional EELS imaging to variations in specimen thickness and can also provide higher spatial resolution. This raises the possibility of lattice resolution imaging of lighter elements or ionization edges previously considered unsuitable for EELS imaging. -- Highlights: Black-Right-Pointing-Pointer We study annular electron energy-loss spectroscopy (AEELS) in STEM. Black-Right-Pointing-Pointer This is more robust to changes in specimen thickness than conventional EELS. Black-Right-Pointing-Pointer AEELS provides higher spatial resolution than conventional EELS. Black-Right-Pointing-Pointer This raises the possibility of lattice resolution imaging of lighter elements.

  8. Reissner's fibre in the rat: a scanning and transmission electron microscope study.

    Science.gov (United States)

    Woollam, D H; Collins, P

    1980-01-01

    The structure and connexions of Reissner's fibre have been studied in the rat by means of scanning and transmission electron microscopy. The fibre was found to arise from a series of filaments, each of which was formed by a structure forming the juxta-aqueductal surface or lining of the subcommissural organ. This structure was termed 'apical spherical protrusion' and was found to be rich in rough endoplasmic reticulum. The fibre was firmly attached at its rostral end to the subcommissural organ, at its middle to the ventral surface of the termination of the aqueduct and finally to the calamus scriptorius of the fourth ventricle. It was held in a state of considerable tension between these three points and attached to it were numerous cilia from the ependymal lining. In sections examined by TEM the fibre appeared to be totally amorphous in structure, with erythrocytes and other debris attached to it. Images Fig. 1 Fig. 2 Fig. 3 Fig. 4 Fig. 5 PMID:7440397

  9. Correlative microscopy of Purkinje dendritic spines: a field emission scanning and transmission electron microscopic study.

    Science.gov (United States)

    Castejón, O J; Castellano, A; Arismendi, G; Apkarian, R

    2004-01-01

    Purkinje dendritic spines (Pds) of mouse cerebellar cortex were examined by field emission scanning electron microscopy (FESEM) and by transmission electron microscopy (TEM) using ultrathin sections and freeze-etching replicas, to study their three-dimensional features and intramembrane morphology. FESEM showed unattached mushroom-type, elongated and lanceolate Pds separated by 100-500 nm on the dendritic shaft surface. High resolution FESEM showed 25-50 nm globular subunits at the spine postsynaptic density corresponding to the localization of postsynaptic proteins and/or postsynaptic receptors. TEM images of ultrathin sections showed gem-like, mushroom-shaped, lanceolate and neckless or stubby spines. Freeze etching replicas exposed postsynaptic intramembrane particles that can be correlated with the globular subunits observed at high resolution FESEM. Parallel and climbing fiber endings were observed making asymmetric synaptic contacts with the Pds heads. Simultaneous contacts with the necks and heads were also found. The variety of Pds shapes were interpreted as spine conformational changes related with spine dynamic, and spine plasticity.

  10. Scanning Electron Microscopic Features of the External and Internal Surfaces of Normal Adult Lacrimal Drainage System.

    Science.gov (United States)

    Ali, Mohammad Javed; Baig, Farhana; Lakshman, Mekala; Naik, Milind N

    2015-01-01

    The aim of this study was to examine the ultrastructural features of the external and internal surfaces of healthy lacrimal drainage systems. A prospective interventional study was performed on the healthy adult lacrimal drainage systems obtained from fresh exenterated specimens. Exenteration was performed for malignancies unrelated to lacrimal system where preoperative lacrimal evaluation was normal. A careful and thorough dissection was carried out to isolate the entire lacrimal drainage system from the punctum to the nasolacrimal duct. The analysis was performed using the standard protocols of scanning electron microscopy. Inner punctal surfaces showed a definite and slightly elevated junction between the luminal surfaces of punctum and beginning of the vertical canaliculus. Similar junction could be identified between the lacrimal sac and nasolacrimal duct. The valves of the canaliculi showed broad rugae-like mucosal surfaces, whereas the external surfaces of the canaliculi demonstrated well-defined orbicularis muscle with collagenous attachments. The walls of the lacrimal sac and nasolacrimal duct showed dense vascular plexus which included wide luminal arteries, throttle veins, and large capacitance vessels. Ultrastructural features of external and internal surfaces of lacrimal drainage system help in better understanding of its anatomy and physiology. The junctional area between the punctum-vertical canaliculus and lacrimal sac-nasolacrimal duct needs further exploration to understand their roles.

  11. In vivo laser scanning microscopic investigation of the decontamination of hazardous substances from the human skin

    Science.gov (United States)

    Lademann, J.; Patzelt, A.; Schanzer, S.; Richter, H.; Gross, I.; Menting, K. H.; Frazier, L.; Sterry, W.; Antoniou, C.

    2010-12-01

    The stimulation of the penetration of topically applied substances into the skin is a topic of intensive dermatological and pharmacological research. In this context, it was found that in addition to the intercellular penetration, the follicular penetration also represents an efficient penetration pathway. The hair follicles act as a long-term reservoir for topically applied substances. They are surrounded by all important target structures, such as blood capillaries, stem and dendritic cells. Therefore, the hair follicles, as well as the skin, need to be protected from hazardous substances. The traditional method of decontamination after respective accidental contacts consists of an intensive washing of the skin. However, during this mechanical procedure, the substances can be pushed even deeper into the hair follicles. In the present study, absorbent materials were applied to remove a fluorescent model substance from the skin without inducing mechanical stress. The results were compared to the decontamination effects obtained by intensive washing. Investigations were performed by means of in vivo laser scanning microscopy (LSM). The comparison revealed that decontamination with absorbent materials is more effective than decontamination with washing processes.

  12. [Scanning electron microscopic investigations on the anatomy of the fetlock joint in horses].

    Science.gov (United States)

    Breit, S; Stiglhuber, A; König, H E

    1997-07-01

    Striking synovial structures were taken and their surface was investigated by scanning electron microscopy. Depending where the probes were taken from, the stratum synovial was arranged in a different way. The synovial intima seems to miss under the tendon of the long/commune extensor muscle, the collateral ligaments and the sesamoidean collateral ligaments. That is why the subsynovial tissue forms the superficial layer. The surface of the probes taken sidewards to the tendon of the extensor muscle and of the synovial fold, which is situated between the metacarpus/metatarsus and the proximal phalanx as well as from the palmar/plantar recess is dominated by synovial intima. Synovial cells are mainly arranged as monolayer. Synovial cells are variable in their appearance. Some resemble blackberrys, others show a quite undulating surface. The length of processes of synovial cells differs from 2-10 microns, the diameter of the synovial cells from 5-10 microns. The space between two cells amounts to 2-10 microns. The intercellular gap is put in relation to the length of the cells' processes. The synovial intima is supposed to form a barrier between the articular cavity and the surrounding structures.

  13. Correlation between auditory brainstem recordings and morphology as seen through the scanning electron microscope

    Energy Technology Data Exchange (ETDEWEB)

    Hultcrantz, M.

    1988-09-01

    Pregnant CBA/CBA mice were exposed to 0.5, 1 and 2 Grey (Gy), (1 Gy = 100 rad) in single doses with whole body gamma-irradiation on the 12th, 13th and 16th gestational days, respectively. The animals were tested at an age of one month for vestibular and cochlear function. Thereafter the inner ears were analyzed with scanning electron microscopy. A morphological analysis with cytocochleograms was performed. Morphological changes in the vestibular part showed gross malformations in the cristae ampullares. Hair cells of type I seemed to be more severely changed than hair cells type II. The macula utriculi also showed malformations of the otoconia. All these changes were more pronounced when the irradiation was given early during pregnancy and with the highest doses used, except the otoconia which were more injured when irradiated day 16 of gestation. No disturbances of the equilibrium reflexes were noted. In the cochlea a dose-dependent, time-related damage pattern was demonstrated with pathological changes of outer (OHC) and inner (IHC) hair cells. When tested electrophysiologically for auditory function with auditory brainstem recordings (ABR), elevated thresholds were revealed different in shape depending on when during pregnancy irradiation took place. A good correlation existed between the morphological changes as seen in the cytocochleograms and the functional changes documented with the ABR.

  14. Exhibition of tunnel coupling of negatively charged dangling bonds on Si Surface Using Scanning Tunneling Microscope

    Science.gov (United States)

    Haider, M. Baseer; Livadaru, L.; Pitters, J.; Wolkow, R.

    2011-03-01

    We have performed Scanning tunneling microscopy study of hydrogen terminated Si (100). We will show that single Si atoms in a solid state environment can be served as quantum dots. These negatively charged quantum dots can be tunnel coupled to the nearby Si quantum dots. We will demonstrate that this tunnel coupling can be controlled by adjusting the separation between the two Si atomic quantum dots. Moreover electron occupation in the tunnel coupled Si quantum dots can be controlled. We have used this tunnel coupling effect of Si atomic quantum dots to fabricate Quantum Cellular Automata Cells. Quantum Cellular Automata are used to transmit binary information through electrostatic interaction between adjacent cells without the transfer of charge from one cell to the next. Devices based on Quantum Cellular Automata will consume much less power compared to the conventional transistor based devices. Moreover, since there is no transfer of charge so power dissipation during its operation is minimal compared to conventional semiconductor devices. This Si based Quantum Cellular Automat Cell works at room temperature.

  15. Comparison of different retreatment techniques and root canal sealers: a scanning electron microscopic study

    Directory of Open Access Journals (Sweden)

    Neslihan Simsek

    2014-05-01

    Full Text Available The aim of this study was to evaluate the effectiveness of two retreatment techniques, in terms of the operating time and scanning electron microscopy (SEM results, in removing three different root canal sealers from root canals that were previously filled with gutta-percha. Sixty extracted single-rooted human premolars were divided into three groups and filled with iRoot SP, MM Seal, and AH Plus sealers, along with gutta-percha, through a lateral compaction technique. Root canal fillings of the samples were removed by ESI ultrasonic tips or R-Endo files. The time to reach the working length was recorded. Longitudinally sectioned samples were examined under SEM magnification. Each picture was evaluated in terms of the residual debris. Data were statistically analyzed with the Kruskall-Wallis test. No statistically significant differences were found in terms of operating time (p>0.05. Significant differences in the number of debris-free dentinal tubules were found among the root canal thirds, but this finding was not influenced by the experimental group (p < 0.05. Resin sealer tags were observed inside the dentinal tubules in the MM Seal group. Under the conditions of this study, it may be established that there was no difference among the sealers and retreatment techniques.

  16. Cell organelles at uncoated cryofractured surfaces as viewed with the scanning electron microscope.

    Science.gov (United States)

    Woods, P S; Ledbetter, M C

    1976-06-01

    A method of direct visualization of cell organelles by scanning electron microscopy (SEM) is described. Plant and animal tissues fixed in glutaraldehyde and osmium tetroxide are treated with the ligand thiocarbohydrazide and a second osmium tetroxide solution, to increase their osmium content. Tissues are then dehydrated, infiltrated with an epoxy monomer, and together solidified with dry ice and fractured. The pieces are transferred to pure acetone, critical-point dried, attached to stubs with silver paint and viewed by SEM. The ligating procedure increases the osmium concentration at its original bonding site sufficiently to render the tissue electrically conductive, thus obviating the need for metallic coating. he organelles at the fractured surface are revaled in relation to their osmium incorporation rather than by surface irregularities as with coating methods. The image derived from the uncoated surface approaches in resolution that of transmission electron micrographs of thin sections. A protion of the image arising from a small distance below the surface, while at progressively lower resolution, provides some 3-dimensional information about cell fine structure.

  17. [Scanning electron microscopic observations on the middle ear mucosa of human fetuses].

    Science.gov (United States)

    Huang, J

    1992-01-01

    The epithelial development of middle ear mucosa in nine human fetuses, ranging from the 12th week to full term, was observed by the scanning electron microscopy. The results showed that the ciliated cells were found in the tympanic cleft of the 12th week fetus. The ciliated cells were especially dense in a crescent region along the antero-inferior periphery of the inner surface of eardrum, and were distributed around the tympanic orifice predominantly, above and blow the promontory and the hypotympanum. The length of cilia and the population of the ciliated cells increased with the fetal age. At the 26th week, the ciliated cell population and the length of cilia were similar to those of the neonate. The goblet cells appeared at the 26th fetal week. The secretory phenomenon of the goblet cells was seen at the 34th fetal age. These findings indicated that the mucociliary transportation system has been developed well at the late period of fetal development.

  18. Scanning Electron Microscopic Structure of the Lingual Papillae of the Common Opossum (Didelphis marsupialis)

    Science.gov (United States)

    Okada, Shigenori; Schraufnagel, Dean E.

    2005-08-01

    The mammalian tongue has evolved for specialized functions in different species. The structure of its papillae tells about the animal's diet, habit, and taxonomy. The opossum has four kinds of lingual papillae (filiform, conical, fungiform, vallate). Scanning electron microscopy of the external features, connective tissue cores, and corrosion casts of the microvasculature show the filiform papillae have a spearhead-like main process and spiny accessory processes around the apical part of the main process. The shape and number of both processes depend on their position on the tongue. On the apex, the main processes have shovel-like capillary networks and the accessory processes have small conical networks. On the lingual radix, the processes have small capillary loops. In the patch region, conical papillae have capillaries arranged as a full sail curving posteriorly. The fungiform papillae are scattered among the filiform papillae and have capillary baskets beneath each taste bud. Giant fungiform papillae on the tongue tip are three to four times larger than the ones on the lingual body. Capillaries of giant papillae form a fan-shaped network. The opossum has three vallate papillae arranged in a triangle. Their tops have secondary capillary loops but not their lateral surfaces. Mucosal folds on the posterolateral border have irregular, fingerlike projections with cylindrical capillary networks. These findings and the structure of the rest of the masticatory apparatus suggest the lingual papillae of opossum have kept their ancestral carnivorous features but also developed the herbivore characteristics of other marsupials.

  19. Effect of ultrasonic excitation on the porosity of glass ionomer cement: a scanning electron microscope evaluation.

    Science.gov (United States)

    Coldebella, Cármen Regina; Santos-Pinto, Lourdes; Zuanon, Angela Cristina Cilense

    2011-01-01

    Ultrasonic excitation (US) was applied to glass ionomer cement (GIC) during early set time to increase the advantageous properties of this material. The aim of this in vitro study was to assess the inner porosity of GIC after US. A total of 16 specimens, for each material, were prepared from high-viscosity GIC Fuji IX GP, Ketac Molar, and Ketac Molar Easymix. Half of these specimens (n = 8) received 30 s of US during the initial cement setting. After completion of the material setting, specimens were fractured and observed by scanning electronic microscopy to quantitatively assay porosity inside the material using Image J software. Statistical data analysis revealed that US reduced the porosity for all tested materials (P ≤ 0.05). The following reductions (expressed in percentages) were achieved: Fuji IX--from 3.9% to 2.8%; Ketac Molar Easy Mix--from 4.4% to 2.6%, and Ketac Molar--from 2.4% to 1.6%. Under the tested conditions, US was an effective method for porosity reduction inside the material. © 2010 Wiley-Liss, Inc.

  20. In Vitro Laser Fenestration of Aortic Stent-Grafts: A Qualitative Analysis Under Scanning Electron Microscope.

    Science.gov (United States)

    Lin, Jing; Udgiri, Naval; Guidoin, Robert; Panneton, Jean; Guan, Xiaoning; Guillemette, Maxime; Wang, Lu; Du, Jia; Zhu, Dajie; Nutley, Mark; Zhang, Ze

    2016-11-01

    In situ fenestration of stent-grafts allows patients with life threatening aortic pathologies to be amenable to emergent "off the shelf indications for use" percutaneous treatments as a bail out technique. Three types of aortic stent-grafts were subjected to laser fenestration in a physiological saline solution followed by balloon angioplasty using 8, 10 or 12 mm in diameter noncompliant balloons. The morphology and the size of fenestrations were observed under optical and scanning electron microscopy. The damage to the fabrics was analyzed and quantified. The creation of fenestrations was feasible in all devices, with varying degrees of fraying and/or tearing. The monofilament twill weave (Medtronic Valiant) tore in two directions (warp and weft) while the multifilament weave fenestrations showed more fraying (Anaconda Vascutek and Zenith TX2 Cook). The size and directions of tearing were more predictable with the 8 mm diameter balloon whereas the results obtained with the 10 and 12 mm diameter balloons were more unpredictable. The fenestrations were free of melting of the yarns and blackening of the filaments. The in situ fenestration is feasible but the observed damage to the fabric constructions must be carefully considered. This procedure must currently be limited to urgent and emergent life threatening cases because it is off indications for use for approved devices. Copyright © 2016 International Center for Artificial Organs and Transplantation and Wiley Periodicals, Inc.