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Sample records for polycrystalline silicon ingots

  1. Impurity segregation behavior in polycrystalline silicon ingot grown with variation of electron-beam power

    Science.gov (United States)

    Lee, Jun-Kyu; Lee, Jin-Seok; Jang, Bo-Yun; Kim, Joon-Soo; Ahn, Young-Soo; Cho, Churl-Hee

    2014-08-01

    Electron beam melting (EBM) systems have been used to improve the purity of metallurgical grade silicon feedstock for photovoltaic application. Our advanced EBM system is able to effectively remove volatile impurities using a heat source with high energy from an electron gun and to continuously allow impurities to segregate at the top of an ingot solidified in a directional solidification (DS) zone in a vacuum chamber. Heat in the silicon melt should move toward the ingot bottom for the desired DS. However, heat flux though the ingot is changed as the ingot becomes longer due to low thermal conductivity of silicon. This causes a non-uniform microstructure of the ingot, finally leading to impurity segregation at its middle. In this research, EB power irradiated on the silicon melt was controlled during the ingot growth in order to suppress the change of heat flux. EB power was reduced from 12 to 6.6 kW during the growth period of 45 min with a drop rate of 0.125 kW/min. Also, the silicon ingot was grown under a constant EB power of 12 kW to estimate the effect of the drop rate of EB power. When the EB power was reduced, the grains with columnar shape were much larger at the middle of the ingot compared to the case of constant EB power. Also, the present research reports a possible reason for the improvement of ingot purity by considering heat flux behaviors.

  2. Process and Information Tracking of Polycrystalline silicon Ingot for Solar Cell%铸锭多晶硅电池生产流程及信息跟踪

    Institute of Scientific and Technical Information of China (English)

    焦富强; 乔卉莹

    2014-01-01

    Si-based photovoltaic materials account for a large proportion in the field of new energy, in which polycrystalline silicon ingot for solar cell is the main type. Many procedures must be used for production of the poly-crystalline silicon solar cell, therefore, accurate recording and tracking information of stuff and procedures play an im-portant role in technical improvement. In this paper, process and information tracking of every procedure in produc-tion of polycrystalline silicon solar cell are discussed, and easy encountered problems in information tracking are ana-lyzed.%在新能源开发利用领域硅基光伏材料占有较大比重,其中铸锭多晶硅光伏电池是当前太阳能电池的主要品种。生产多晶硅电池需要经历众多的加工工序,准确有序记录和跟踪物料流向及各工序相关信息是工艺研究和技术改进的基础。就铸锭多晶硅电池片生产流程及各工序信息跟踪问题进行了论述,并对实施信息跟踪时易出现的问题进行了分析。

  3. Process Research on Polycrystalline Silicon Material (PROPSM)

    Science.gov (United States)

    Culik, J. S.; Wrigley, C. Y.

    1985-01-01

    Results of hydrogen-passivated polycrysalline silicon solar cell research are summarized. The short-circuit current of solar cells fabricated from large-grain cast polycrystalline silicon is nearly equivalent to that of single-crystal cells, which indicates long bulk minority-carrier diffusion length. Treatments with molecular hydrogen showed no effect on large-grain cast polycrystalline silicon solar cells.

  4. Effect of localized polycrystalline silicon properties on solar cell performance

    Science.gov (United States)

    Leung, D.; Iles, P. A.; Hyland, S.; Kachare, A.

    1984-01-01

    Several forms of polycrystalline silicon, mostly from cast ingots, (including UCP, SILSO and HEM) were studied. On typical slices, localized properties were studied in two ways. Small area (about 2.5 sq mm) mesa diodes were formed, and localized photovoltaic properties were measured. Also a small area (about .015 sq mm) light spot was scanned across the cells; the light spot response was calibrated to measure local diffusion length directly. Using these methods, the effects of grain boundaries, or of intragrain imperfections were correlated with cell performance. Except for the fine grain portion of SILSO, grain boundaries played only a secondary role in determining cell performance. The major factor was intra-grain material quality and it varied with position in ingots and probably related to solidification procedure.

  5. Polycrystalline Silicon: a Biocompatibility Assay

    International Nuclear Information System (INIS)

    Pecheva, E.; Fingarova, D.; Pramatarova, L.; Hikov, T.; Laquerriere, P.; Bouthors, Sylvie; Dimova-Malinovska, D.; Montgomery, P.

    2010-01-01

    Polycrystalline silicon (poly-Si) layers were functionalized through the growth of biomimetic hydroxyapatite (HA) on their surface. HA is the mineral component of bones and teeth and thus possesses excellent bioactivity and biocompatibility. MG-63 osteoblast-like cells were cultured on both HA-coated and un-coated poly-Si surfaces for 1, 3, 5 and 7 days and toxicity, proliferation and cell morphology were investigated. The results revealed that the poly-Si layers were bioactive and compatible with the osteoblast-like cells. Nevertheless, the HA coating improved the cell interactions with the poly-Si surfaces based on the cell affinity to the specific chemical composition of the bone-like HA and/or to the higher HA roughness.

  6. Arsenic implantation into polycrystalline silicon and diffusion to silicon substrate

    International Nuclear Information System (INIS)

    Tsukamoto, K.; Akasaka, Y.; Horie, K.

    1977-01-01

    Arsenic implantation into polycrystalline silicon and drive-in diffusion to silicon substrate have been investigated by MeV He + backscattering analysis and also by electrical measurements. The range distributions of arsenic implanted into polycrystalline silicon are well fitted to Gaussian distributions over the energy range 60--350 keV. The measured values of R/sub P/ and ΔR/sub P/ are about 10 and 20% larger than the theoretical predictions, respectively. The effective diffusion coefficient of arsenic implanted into polycrystalline silicon is expressed as D=0.63 exp[(-3.22 eV/kT)] and is independent of the arsenic concentration. The drive-in diffusion of arsenic from the implanted polycrystalline silicon layer into the silicon substrate is significantly affected by the diffusion atmosphere. In the N 2 atmosphere, a considerable amount of arsenic atoms diffuses outward to the ambient. The outdiffusion can be suppressed by encapsulation with Si 3 N 4 . In the oxidizing atmosphere, arsenic atoms are driven inward by growing SiO 2 due to the segregation between SiO 2 and polycrystalline silicon, and consequently the drive-in diffusion of arsenic is enhanced. At the interface between the polycrystalline silicon layer and the silicon substrate, arsenic atoms are likely to segregate at the polycrystalline silicon side

  7. Obtaining of polycrystalline silicon for semiconductor industry

    International Nuclear Information System (INIS)

    Mukashev, F.; Nauryzbaev, M.; Kolesnikov, B.; Ivanov, Y.

    1996-01-01

    The purpose of the project is to create pilot equipment and optimize the process of obtaining polycrystalline silicon on semi-industrial level. In the past several decades, the historical experience in the developing countries has shown that one of the most promising ways to improve the economy,of a country is to establish semiconductor industry. First of all, the results can help increase defense, national security and create industrial production. The silane method, which has been traditionally' used for obtaining technical and polycrystalline silicon, is to obtain and then to pyrolyzed mono-and poly silanes. Although the traditional methods of obtaining silicon hydrides have specific advantages, such as utilizing by-products, they also have clear shortcomings, i.e. either low output of the ultimate product ( through hydrolysis of Mg 2 Si) or high contents of by-products in it or high contents of dissolving vapors (through decomposing Mg 2 Si in non-water solutions)

  8. Equilibrium shapes of polycrystalline silicon nanodots

    Energy Technology Data Exchange (ETDEWEB)

    Korzec, M. D., E-mail: korzec@math.tu-berlin.de; Wagner, B., E-mail: bwagner@math.tu-berlin.de [Department of Mathematics, Technische Universität Berlin, Straße des 17. Juni 136, 10623 Berlin (Germany); Roczen, M., E-mail: maurizio.roczen@physik.hu-berlin.de [Department of Physics, Humboldt-Universität zu Berlin, Newtonstraße 15, 12489 Berlin (Germany); Schade, M., E-mail: martin.schade@physik.uni-halle.de [Zentrum für Innovationskompetenz SiLi-nano, Martin-Luther-Universität Halle-Wittenberg, Karl-Freiherr-von-Fritsch-Straße 3, 06120 Halle (Germany); Rech, B., E-mail: bernd.rech@helmholtz-berlin.de [Helmholtz-Zentrum Berlin, Institute for Silicon Photovoltaics, Kekuléstraße 5, 12489 Berlin (Germany)

    2014-02-21

    This study is concerned with the topography of nanostructures consisting of arrays of polycrystalline nanodots. Guided by transmission electron microscopy (TEM) measurements of crystalline Si (c-Si) nanodots that evolved from a “dewetting” process of an amorphous Si (a-Si) layer from a SiO{sub 2} coated substrate, we investigate appropriate formulations for the surface energy density and transitions of energy density states at grain boundaries. We introduce a new numerical minimization formulation that allows to account for adhesion energy from an underlying substrate. We demonstrate our approach first for the free standing case, where the solutions can be compared to well-known Wulff constructions, before we treat the general case for interfacial energy settings that support “partial wetting” and grain boundaries for the polycrystalline case. We then use our method to predict the morphologies of silicon nanodots.

  9. Hydrogenation of polycrystalline silicon thin films

    Czech Academy of Sciences Publication Activity Database

    Honda, Shinya; Mates, Tomáš; Knížek, Karel; Ledinský, Martin; Fejfar, Antonín; Kočka, Jan; Yamazaki, T.; Uraoka, Y.; Fuyuki, T.

    2006-01-01

    Roč. 501, - (2006), s. 144-148 ISSN 0040-6090 R&D Projects: GA MŠk ME 537; GA MŽP(CZ) SM/300/1/03; GA AV ČR(CZ) IAA1010316; GA AV ČR(CZ) IAA1010413; GA ČR(CZ) GA202/03/0789 Institutional research plan: CEZ:AV0Z1010914 Keywords : polycrystalline silicon * atmospheric pressure chemical vapour deposition * hydrogen passivation * photoluminescence * Raman spectroscopy * Si-H 2 bonding * hydrogen molecules Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.666, year: 2006

  10. Field performance of a polycrystalline silicon module

    International Nuclear Information System (INIS)

    Adegboyega, G.A.; Kuku, T.A.; Salau, A.A.M.

    1985-12-01

    The field performance of a polycrystalline silicon module is reported. The recorded data include the ambient temperature, solar insolation and the module output power. The module has given efficiencies in the range of 2-4% and has demonstrated good stability over a ten month period. From the field data, equations that could be used to predict performance for various seasons of the year for this location have been developed and the fit between predicted and actual performance has been found to be quite good. (author)

  11. Polycrystalline silicon semiconducting material by nuclear transmutation doping

    Science.gov (United States)

    Cleland, John W.; Westbrook, Russell D.; Wood, Richard F.; Young, Rosa T.

    1978-01-01

    A NTD semiconductor material comprising polycrystalline silicon having a mean grain size less than 1000 microns and containing phosphorus dispersed uniformly throughout the silicon rather than at the grain boundaries.

  12. Polycrystalline Silicon Gettered by Porous Silicon and Heavy Phosphorous Diffusion

    Institute of Scientific and Technical Information of China (English)

    LIU Zuming(刘祖明); Souleymane K Traore; ZHANG Zhongwen(张忠文); LUO Yi(罗毅)

    2004-01-01

    The biggest barrier for photovoltaic (PV) utilization is its high cost, so the key for scale PV utilization is to further decrease the cost of solar cells. One way to improve the efficiency, and therefore lower the cost, is to increase the minority carrier lifetime by controlling the material defects. The main defects in grain boundaries of polycrystalline silicon gettered by porous silicon and heavy phosphorous diffusion have been studied. The porous silicon was formed on the two surfaces of wafers by chemical etching. Phosphorous was then diffused into the wafers at high temperature (900℃). After the porous silicon and diffusion layers were removed, the minority carrier lifetime was measured by photo-conductor decay. The results show that the lifetime's minority carriers are increased greatly after such treatment.

  13. Determination of impurity distributions in ingots of solar grade silicon by neutron activation analysis

    Energy Technology Data Exchange (ETDEWEB)

    Karches, Barbara; Hampel, Gabriele; Plonka, Christian; Stieghorst, Christian; Wiehl, Norbert [Mainz Univ. (Germany). Inst. for Nuclear Chemistry; Schoen, Jonas; Krenckel, Patricia; Riepe, Stephan [Fraunhofer Institute for Solar Energy Systems, Freiburg (Germany); Gerstenberg, Heiko [Technische Univ. Muenchen, Garching (Germany). Heinz-Maier-Leibniz Zentrum; Ponsard, Bernard [Belgian Nuclear Research Centre (SCK CEN), Mol (Belgium). BR2 reactor

    2017-09-01

    In a series of crystallization experiments, the directional solidification of silicon was investigated as a low cost path for the production of silicon wafers for solar cells. Instrumental neutron activation analysis was employed to measure the influence of different crystallization parameters on the distribution of 3d-metal impurities of the produced ingots. A theoretical model describing the involved diffusion and segregation processes during the solidification and cooling of the ingots could be verified by the experimental results. By successive etching of the samples after the irradiation, it could be shown that a layer of at least 60 μm of the samples has to be removed to get real bulk concentrations.

  14. Improving the Quality of the Deteriorated Regions of Multicrystalline Silicon Ingots during General Solar Cell Processes

    International Nuclear Information System (INIS)

    Wu Shan-Shan; Wang Lei; Yang De-Ren

    2011-01-01

    The behavior of wafers and solar cells from the border of a multicrystalline silicon (mc-Si) ingot, which contain deteriorated regions, is investigated. It is found that the diffusion length distribution of minority carriers in the cells is uniform, and high efficiency of the solar cells (about 16%) is achieved. It is considered that the quality of the deteriorated regions could be improved to be similar to that of adjacent regions. Moreover, it is indicated that during general solar cell fabrication, phosphorus gettering and hydrogen passivation could significantly improve the quality of deteriorated regions, while aluminum gettering by RTP could not. Therefore, it is suggested that the border of a mc-Si ingot could be used to fabricate high efficiency solar cells, which will increase mc-Si utilization effectively. (condensed matter: structure, mechanical and thermal properties)

  15. Hall measurements and grain-size effects in polycrystalline silicon

    International Nuclear Information System (INIS)

    Ghosh, A.K.; Rose, A.; Maruska, H.P.; Eustace, D.J.; Feng, T.

    1980-01-01

    The effects of grain size on Hall measurements in polycrystalline silicon are analyzed and interpreted, with some modifications, using the model proposed by Bube. This modified model predicts that the measured effective Hall voltage is composed of components originating from the bulk and space-charge regions. For materials with large grain sizes, the carrier concentration is independent of the intergrain boundary barrier, whereas the mobility is dependent on it. However, for small grains, both the carrier density and mobility depend on the barrier. These predictions are consistent with experimental results of mm-size Wacker and μm-size neutron-transmutation-doped polycrystalline silicon

  16. Spectral response of a polycrystalline silicon solar cell

    International Nuclear Information System (INIS)

    Ba, B.; Kane, M.

    1994-10-01

    A theoretical study of the spectral response of a polycrystalline silicon n-p junction solar cell is presented. The case of a fibrously oriented grain structure, involving grain boundary recombination velocity and grain size effects is discussed. The contribution of the base region on the internal quantum efficiency Q int is computed for different grain sizes and grain boundary recombination velocities in order to examine their influence. Suggestions are also made for the determination of base diffusion length in polycrystalline silicon solar cells using the spectral response method. (author). 15 refs, 4 figs

  17. Large-Scale PV Module Manufacturing Using Ultra-Thin Polycrystalline Silicon Solar Cells: Final Subcontract Report, 1 April 2002--28 February 2006

    Energy Technology Data Exchange (ETDEWEB)

    Wohlgemuth, J.; Narayanan, M.

    2006-07-01

    The major objectives of this program were to continue advances of BP Solar polycrystalline silicon manufacturing technology. The Program included work in the following areas. (1) Efforts in the casting area to increase ingot size, improve ingot material quality, and improve handling of silicon feedstock as it is loaded into the casting stations. (2) Developing wire saws to slice 100-..mu..m-thick silicon wafers on 290-..mu..m-centers. (3) Developing equipment for demounting and subsequent handling of very thin silicon wafers. (4) Developing cell processes using 100-..mu..m-thick silicon wafers that produce encapsulated cells with efficiencies of at least 15.4% at an overall yield exceeding 95%. (5) Expanding existing in-line manufacturing data reporting systems to provide active process control. (6) Establishing a 50-MW (annual nominal capacity) green-field Mega-plant factory model template based on this new thin polycrystalline silicon technology. (7) Facilitating an increase in the silicon feedstock industry's production capacity for lower-cost solar-grade silicon feedstock..

  18. Large-Scale PV Module Manufacturing Using Ultra-Thin Polycrystalline Silicon Solar Cells: Annual Subcontract Report, 1 October 2003--30 September 2004

    Energy Technology Data Exchange (ETDEWEB)

    Wohlgemuth, J.; Narayanan, M.

    2005-03-01

    The major objectives of this program are to continue the advancement of BP Solar polycrystalline silicon manufacturing technology. The program includes work in the following areas: Efforts in the casting area to increase ingot size, improve ingot material quality, and improve handling of silicon feedstock as it is loaded into the casting stations; developing wire saws to slice 100- m-thick silicon wafers on 290- m centers; developing equipment for demounting and subsequent handling of very thin silicon wafers; developing cell processes using 100- m-thick silicon wafers that produce encapsulated cells with efficiencies of at least 15.4% at an overall yield exceeding 95%; expanding existing in-line manufacturing data reporting systems to provide active process control; establishing a 50-MW (annual nominal capacity) green-field Mega-plant factory model template based on this new thin polycrystalline silicon technology; facilitating an increase in the silicon feedstock industry's production capacity for lower-cost solar-grade silicon feedstock.

  19. Influence of additional heat exchanger block on directional solidification system for growing multi-crystalline silicon ingot - A simulation investigation

    Science.gov (United States)

    Nagarajan, S. G.; Srinivasan, M.; Aravinth, K.; Ramasamy, P.

    2018-04-01

    Transient simulation has been carried out for analyzing the heat transfer properties of Directional Solidification (DS) furnace. The simulation results revealed that the additional heat exchanger block under the bottom insulation on the DS furnace has enhanced the control of solidification of the silicon melt. Controlled Heat extraction rate during the solidification of silicon melt is requisite for growing good quality ingots which has been achieved by the additional heat exchanger block. As an additional heat exchanger block, the water circulating plate has been placed under the bottom insulation. The heat flux analysis of DS system and the temperature distribution studies of grown ingot confirm that the established additional heat exchanger block on the DS system gives additional benefit to the mc-Si ingot.

  20. Large-Scale PV Module Manufacturing Using Ultra-Thin Polycrystalline Silicon Solar Cells: Annual Subcontract Report, 1 April 2002--30 September 2003 (Revised)

    Energy Technology Data Exchange (ETDEWEB)

    Wohlgemuth, J.; Shea, S. P.

    2004-04-01

    The goal of BP Solar's Crystalline PVMaT program is to improve the present polycrystalline silicon manufacturing facility to reduce cost, improve efficiency, and increase production capacity. Key components of the program are: increasing ingot size; improving ingot material quality; improving material handling; developing wire saws to slice 100 ..mu..m thick silicon wafers on 200 ..mu..m centers; developing equipment for demounting and subsequent handling of very thin silicon wafers; developing cell processes using 100 ..mu..m thick silicon wafers that produce encapsulated cells with efficiencies of at least 15.4% at an overall yield exceeding 95%; expanding existing in-line manufacturing data reporting systems to provide active process control; establishing a 50 MW (annual nominal capacity) green-field Mega plant factory model template based on this new thin polycrystalline silicon technology; and facilitating an increase in the silicon feedstock industry's production capacity for lower-cost solar-grade silicon feedstock.

  1. Low cost monocrystalline silicon sheet fabrication for solar cells by advanced ingot technology

    Science.gov (United States)

    Fiegl, G. F.; Bonora, A. C.

    1980-01-01

    The continuous liquid feed (CLF) Czochralski furnace and the enhanced I.D. slicing technology for the low-cost production of monocrystalline silicon sheets for solar cells are discussed. The incorporation of the CLF system is shown to improve ingot production rate significantly. As demonstrated in actual runs, higher than average solidification rates (75 to 100 mm/hr for 150 mm 1-0-0 crystals) can be achieved, when the system approaches steady-state conditions. The design characteristics of the CLF furnace are detailed, noting that it is capable of precise control of dopant impurity incorporation in the axial direction of the crystal. The crystal add-on cost is computed to be $11.88/sq m, considering a projected 1986 25-slice per cm conversion factor with an 86% crystal growth yield.

  2. Process Research of Polycrystalline Silicon Material (PROPSM)

    Science.gov (United States)

    Culik, J. S.

    1984-01-01

    An investigation was begun into the usefulness of molecular hydrogen annealing on polycrystalline solar cells. No improvement was realized even after twenty hours of hydrogenation. Thus, samples were chosen on the basis of: (1) low open circuit voltage; (2) low shunt conductance; and (3) high light generated current. These cells were hydrogenated in molecular hydrogen at 300 C. The differences between the before and after hydrogenation values are so slight as to be negligible. These cells have light generated current densities that indicate long minority carrier diffusion lengths. The open circuit voltage appears to be degraded, and quasi-neutral recombination current enhanced. Therefore, molecular hydrogen is not usful for passivating electrically active defects.

  3. Effect of hydrogen passivation on polycrystalline silicon thin films

    Czech Academy of Sciences Publication Activity Database

    Honda, Shinya; Mates, Tomáš; Ledinský, Martin; Oswald, Jiří; Fejfar, Antonín; Kočka, Jan; Yamazaki, T.; Uraoka, Y.; Fuyuki, T.

    2005-01-01

    Roč. 487, - (2005), s. 152-156 ISSN 0040-6090 R&D Projects: GA AV ČR(CZ) IAA1010316; GA AV ČR(CZ) IAA1010413; GA ČR(CZ) GD202/05/H003 Institutional research plan: CEZ:AV0Z10100521 Keywords : hydrogen passivation * polycrystalline silicon * photoluminescence * Raman spectroscopy * Si-H 2 * hydrogen molecules Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.569, year: 2005

  4. Quality Management for Neutron Transmutation Doping of Silicon Ingot in HANARO

    Energy Technology Data Exchange (ETDEWEB)

    Kang, Ki-Doo; Kim, Ji-Uk; Yun, Hwa-Kyung; Lim, Chul-Hong; Kim, Young-Chil; Kim, Myong-Seop; Park, Sang-Jun [Korea Atomic Energy Research Institute, Daejeon (Korea, Republic of)

    2007-10-15

    By using this doping method, silicon semiconductors with extremely uniform dopant distributions can be produced, and this is the dominant advantage of NTD compared with a conventional chemical doping. Good uniformity of a dopant concentration is usually required for high power applications such as thyristor (SCR), IGBT, IGCT and GTO and for special sensors. Achieving an accurate neutron fluence corresponding to a target resistivity as well as a uniform irradiation is the prime target of a neutron irradiation for NTD. Generally, in order to reach an accurate neutron fluence, a real time neutron flux is monitored by a neutron detector such as a Self-powered Neutron Detector(SPND). And, after an irradiation, the total irradiation fluence is confirmed by measuring the absolute activity of a neutron activation sample that has been irradiated with a silicon ingot, and thus the SPND can be properly calibrated. Excellent irradiation uniformity and a high accuracy for a target neutron dose have been achieved from the early works of NTD. However, to maintain this excellent quality, the neutron irradiation fluence should be continuously modified and controlled. So, in this work, an activity to maintain the irradiation quality is introduced.

  5. Incorporation, diffusion and segregation of impurities in polycrystalline silicon

    Energy Technology Data Exchange (ETDEWEB)

    Deville, J.P.; Soltani, M.L. (Universite Louis Pasteur, 67 - Strasbourg (France)); Quesada, J. (Laboratoire de Metallurgie-Chimie des Materiaux, E.N.S.A.I.S., 67 - Strasbourg (France))

    1982-01-01

    We studied by means of X-Ray photoelectron Spectroscopy the nature, distribution and, when possible, the chemical bond of impurities at the surface of polycrystalline silicon samples grown on a carbon ribbon. Besides main impurities (carbon and oxygen), always present at concentrations around their limit of solubility in silicon, metal impurities have been found: their nature varies from one sample to another. Their spatial distribution is not random: some are strictly confined at the surface (sodium), whereas others are in the superficial oxidized layer (calcium, magnesium) or localized at the oxide-bulk silicon interface (iron). Metal impurities are coming from the carbon ribbon and are incorporated to silicon during the growth process. It is not yet possible to give a model of diffusion processes of impurities since they are too numerous and interact one with the other. However oxygen seems to play a leading role in the spatial distribution of metal impurities.

  6. Neutron transmutation doping of polycrystalline silicon

    International Nuclear Information System (INIS)

    Cleland, J.W.; Westbrook, R.D.; Wood, R.F.; Young, R.T.

    1976-04-01

    Chemical vapor deposition (CVD) of doped silane has been used by others to deposit a polycrytalline silicon film (polysil) on metal or graphite substrates, but dopant migration to grain boundaries during deposition apparently prohibits attaining a uniform or desired dopant concentration. In contrast, we have used neutron transmutation doping to introduce a uniform phosphorus dopant concentration in commercially available undoped CVD polysil at doping concentrations greater than or equal to 2 x 10 15 cm -3 . Radiation damage annealing to 800 0 C did not indicate dopant migration. Carrier mobility increased with doping concentration and the minority carrier lifetime (MCL) appears to be comparable to that of neutron transmutation doped (NTD) single crystal Si. Application of this technique to photovoltaic solar cell fabrication is discussed

  7. Thin-film polycrystalline silicon solar cells

    Science.gov (United States)

    Funghnan, B. W.; Blanc, J.; Phillips, W.; Redfield, D.

    1980-08-01

    Thirty-four new solar cells were fabricated on Wacker Sislo substrates and the AM-1 parameters were measured. A detailed comparison was made between the measurement of minority carrier diffusion length by the OE method and the penetrating light laser scan grain boundary photoresponse linewidth method. The laser scan method has more experimental uncertainty and agrees within 10 to 50% with the QE method. It allows determination of L over a large area. Atomic hydrogen passivation studies continued on Wacker material by three techniques. A method of determining surface recombination velocity, s, from laser scan data was developed. No change in s in completed solar cells after H-plasma treatment was observed within experimental error. H-passivation of bare silicon cars as measured by the new laser scan photoconductivity technique showed very large effects.

  8. Influence of Crucible Thermal Conductivity on Crystal Growth in an Industrial Directional Solidification Process for Silicon Ingots

    Directory of Open Access Journals (Sweden)

    Zaoyang Li

    2016-01-01

    Full Text Available We carried out transient global simulations of heating, melting, growing, annealing, and cooling stages for an industrial directional solidification (DS process for silicon ingots. The crucible thermal conductivity is varied in a reasonable range to investigate its influence on the global heat transfer and silicon crystal growth. It is found that the crucible plays an important role in heat transfer, and therefore its thermal conductivity can influence the crystal growth significantly in the entire DS process. Increasing the crucible thermal conductivity can shorten the time for melting of silicon feedstock and growing of silicon crystal significantly, and therefore large thermal conductivity is helpful in saving both production time and power energy. However, the high temperature gradient in the silicon ingots and the locally concave melt-crystal interface shape for large crucible thermal conductivity indicate that high thermal stress and dislocation propagation are likely to occur during both growing and annealing stages. Based on the numerical simulations, some discussions on designing and choosing the crucible thermal conductivity are presented.

  9. Polycrystalline silicon availability for photovoltaic and semiconductor industries

    Science.gov (United States)

    Ferber, R. R.; Costogue, E. N.; Pellin, R.

    1982-01-01

    Markets, applications, and production techniques for Siemens process-produced polycrystalline silicon are surveyed. It is noted that as of 1982 a total of six Si materials suppliers were servicing a worldwide total of over 1000 manufacturers of Si-based devices. Besides solar cells, the Si wafers are employed for thyristors, rectifiers, bipolar power transistors, and discrete components for control systems. An estimated 3890 metric tons of semiconductor-grade polycrystalline Si will be used in 1982, and 6200 metric tons by 1985. Although the amount is expected to nearly triple between 1982-89, research is being carried out on the formation of thin films and ribbons for solar cells, thereby eliminating the waste produced in slicing Czolchralski-grown crystals. The free-world Si production in 1982 is estimated to be 3050 metric tons. Various new technologies for the formation of polycrystalline Si at lower costs and with less waste are considered. New entries into the industrial Si formation field are projected to produce a 2000 metric ton excess by 1988.

  10. Friction and dynamically dissipated energy dependence on temperature in polycrystalline silicon MEMS devices

    NARCIS (Netherlands)

    Gkouzou, A.; Kokorian, J.; Janssen, G.C.A.M.; van Spengen, W.M.

    2017-01-01

    In this paper, we report on the influence of capillary condensation on the sliding friction of sidewall surfaces in polycrystalline silicon micro-electromechanical
    systems (MEMS). We developed a polycrystalline silicon MEMS tribometer, which is a microscale test device with two components

  11. Hydrogen-induced structural changes in polycrystalline silicon as revealed by positron lifetime spectroscopy

    International Nuclear Information System (INIS)

    Arole, V.M.; Takwale, M.G.; Bhide, V.G.

    1989-01-01

    Hydrogen passivation of polycrystalline silicon wafer is carried out in order to reduce the deleterious effects of grain boundaries. A systematic variation is made in the process parameters implemented during hydrogen passivation and the results of room temperature resistivity measurements are reported. As an efficient tool to study the structure change, positron lifetime spectroscopic measurements are performed on original and hydrogenated polycrystalline silicon wafers and a systematic correlation is sought between the changes that take place in the electrical and structural properties of polycrystalline silicon wafer, brought about by hydrogen passivation. (author)

  12. Silicon Ingot Casting - Heat Exchanger Method (HEM). Multi-Wire Slicing - Fixed Abrasive Slicing Technique (Fast). Phase 4 Silicon Sheet Growth Development for the Large Area Sheet Task of the Low-Cost Solar Array Project

    Science.gov (United States)

    Schmid, F.

    1981-01-01

    The crystallinity of large HEM silicon ingots as a function of heat flow conditions is investigated. A balanced heat flow at the bottom of the ingot restricts spurious nucleation to the edge of the melted-back seed in contact with the crucible. Homogeneous resistivity distribution over all the ingot has been achieved. The positioning of diamonds electroplated on wirepacks used to slice silicon crystals is considered. The electroplating of diamonds on only the cutting edge is described and the improved slicing performance of these wires evaluated. An economic analysis of value added costs of HEM ingot casting and band saw sectioning indicates the projected add on cost of HEM is well below the 1986 allocation.

  13. Mechanisms limiting the performance of large grain polycrystalline silicon solar cells

    Science.gov (United States)

    Culik, J. S.; Alexander, P.; Dumas, K. A.; Wohlgemuth, J. W.

    1984-01-01

    The open-circuit voltage and short-circuit current of large-grain (1 to 10 mm grain diameter) polycrystalline silicon solar cells is determined by the minority-carrier diffusion length within the bulk of the grains. This was demonstrated by irradiating polycrystalline and single-crystal (Czochralski) silicon solar cells with 1 MeV electrons to reduce their bulk lifetime. The variation of short-circuit current with minority-carrier diffusion length for the polycrystalline solar cells is identical to that of the single-crystal solar cells. The open-circuit voltage versus short-circuit current characteristic of the polycrystalline solar cells for reduced diffusion lengths is also identical to that of the single-crystal solar cells. The open-circuit voltage of the polycrystalline solar cells is a strong function of quasi-neutral (bulk) recombination, and is reduced only slightly, if at all, by grain-boundary recombination.

  14. Porous silicon-based passivation and gettering in polycrystalline silicon solar cells

    International Nuclear Information System (INIS)

    Dimassi, W.; Bouaiecha, M.; Saadoun, M.; Bessaies, B.; Ezzaouia, H.; Bennaceur, R.

    2002-01-01

    In this work, we report on the effect of introducing a superficial porous silicon (PS) layer on the electrical characteristics of polycrystalline silicon solar cells. The PS layer was formed using a vapour etching (VE)-based method. In addition to its known anti-reflecting action, the forming hydrogen-rich PS layer acts as a passivating agent for the surface of the cell. As a result we found an improvement of the I-V characteristics in dark conditions and AM1 illumination. We show that when the formation of a superficial PS layer is followed by a heat treatment, gettering of impurities from the polycrystalline silicon material is possible. After the removal of the PS layer and the formation of the photovoltaic (PV) structure, we observed an increase of the light-beam-induced-current (LBIC) for treatment temperatures not exceeding 900 deg. C. An improvement of the bulk minority carrier diffusion length and the grain boundary (GB) recombination velocity were observed as the temperature rises, although a global decrease of the LBIC current was observed for temperatures greater than 900 deg. C

  15. Synthesis and characterization of silicon-doped polycrystalline GaN ...

    Indian Academy of Sciences (India)

    Silicon-doped polycrystalline GaN films were successfully deposited at temperatures ranging from 300 to 623 K on fused silica and silicon substrates by radio frequency (r.f.) magnetron sputtering at a system pressure of ~ 5 Pa. The films were characterized by optical as well as microstructural measurements. The optical ...

  16. Influence of wavelength on transient short-circuit current in polycrystalline silicon solar cells

    International Nuclear Information System (INIS)

    Ba, B.; Kane, M.

    1993-10-01

    The influence of the wavelength of a monochromatic illumination on transient short-circuit current in an n/p polycrystalline silicon part solar cell junction is investigated. A wavelength dependence in the initial part of the current decay is observed in the case of cells with moderate grain boundary effects. This influence is attenuated in polycrystalline cells with strong grain boundary activity. (author). 10 refs, 6 figs

  17. Front buried metallic contacts and thin porous silicon combination for efficient polycrystalline silicon solar cells

    International Nuclear Information System (INIS)

    Ben Rabha, M.; Boujmil, M.F.; Meddeb, N.; Saadoun, M.; Bessais, B.

    2006-01-01

    We investigate the impacts of achieving buried grid metallic contacts (BGMC), with and without application of a front porous silicon (PS) layer, on the photovoltaic properties of polycrystalline silicon (pc-Si) solar cells. A grooving method based on Chemical Vapor Etching (CVE) was used to perform buried grid contacts on the emitter of pc-Si solar cells. After realizing the n + /p junction using a phosphorus diffusion source, BGMCs were realized using the screen printing technique. We found that the buried metallic contacts improve the short circuit current from 16 mA/cm 2 (for reference cell without buried contacts) to about 19 mA/cm 2 . After application of a front PS layer on the n + emitter, we observe an enhancement of the short circuit current from 19 to 24 mA/cm 2 with a decrease of the reflectivity by about 40% of its initial value. The dark I-V characteristics of the pc-Si cells with PS-based emitter show an important reduction of the reverse current together with an improvement of the rectifying behaviour. Spectral response measurements performed at a wavelength range of 400-1100 nm showed a significant increase in the quantum efficiency, particularly at shorter wavelength (400-650 nm). These results indicate that the BGMCs improve the carrier collection and that the PS layer acts as an antireflective coating that reduces reflection losses and passivates the front surface. This low cost and simple technology based on the CVE technique could enable preparing efficient polycrystalline silicon solar cells

  18. Metal impurities profile in a 450kg multi-crystalline silicon ingot by Cold Neutron Prompt Gamma-ray Activation Analysis

    International Nuclear Information System (INIS)

    Baek, Hani; Sun, Gwang Min; Kim, Ji seok; Oh, Mok; Chung, Yong Sam; Moon, Jong Hwa; Kim, Sun Ha; Baek, Sung Yeol; Tuan, Hoang Sy Minh

    2014-01-01

    Metal impurities are harmful to multi-crystalline silicon solar cells. They reduce solar cell conversion efficiencies through increased carrier recombination. They are present as isolated point-like impurities or precipitates. This work is to study the concentration profiles of some metal impurities of the directionally solidified 450kg multi-crystalline silicon ingot grown for solar cell production. The concentration of such impurities are generally below 10 15 cm -3 , and as such cannot be detected by physical techniques such as secondary-ion-mass spectroscopy(SIMS). So, we have tried to apply Cold Neutron - Prompt Gamma ray Activation Analysis(CN-PGAA) at the HANARO reactor research. The impurity concentrations of Au, Mn, Pt, Mo of a photovoltaic grade multi-crystalline silicon ingot appear by segregation from the liquid to the solid phase in the central region of the ingot during the crystallization. In the impurities concentration of the bottom region is higher than middle region due to the solid state diffusion. Towards the top region the segregation impurities diffused, during cooling process

  19. Laser induced single-crystal transition in polycrystalline silicon

    International Nuclear Information System (INIS)

    Vitali, G.; Bertolotti, M.; Foti, G.; Rimini, E.

    1978-01-01

    Transition to single crystal of polycrystalline Si material underlying a Si crystal substrate of 100 orientation was obtained via laser irradiation. The changes in the structure were analyzed by reflection high energy electron diffraction and by channeling effect technique using 2.0 MeV He Rutherford scattering. The power density required to induce the transition in a 4500 A thick polycrystalline layer is about 70 MW/cm 2 (50ns). The corresponding amorphous to single transition has a threshold of about 45 MW/cm 2 . (orig.) 891 HPOE [de

  20. Process Research On Polycrystalline Silicon Material (PROPSM). [flat plate solar array project

    Science.gov (United States)

    Culik, J. S.

    1983-01-01

    The performance-limiting mechanisms in large-grain (greater than 1 to 2 mm in diameter) polycrystalline silicon solar cells were investigated by fabricating a matrix of 4 sq cm solar cells of various thickness from 10 cm x 10 cm polycrystalline silicon wafers of several bulk resistivities. Analysis of the illuminated I-V characteristics of these cells suggests that bulk recombination is the dominant factor limiting the short-circuit current. The average open-circuit voltage of the polycrystalline solar cells is 30 to 70 mV lower than that of co-processed single-crystal cells; the fill-factor is comparable. Both open-circuit voltage and fill-factor of the polycrystalline cells have substantial scatter that is not related to either thickness or resistivity. This implies that these characteristics are sensitive to an additional mechanism that is probably spatial in nature. A damage-gettering heat-treatment improved the minority-carrier diffusion length in low lifetime polycrystalline silicon, however, extended high temperature heat-treatment degraded the lifetime.

  1. A new computer-aided simulation model for polycrystalline silicon film resistors

    Science.gov (United States)

    Ching-Yuan Wu; Weng-Dah Ken

    1983-07-01

    A general transport theory for the I-V characteristics of a polycrystalline film resistor has been derived by including the effects of carrier degeneracy, majority-carrier thermionic-diffusion across the space charge regions produced by carrier trapping in the grain boundaries, and quantum mechanical tunneling through the grain boundaries. Based on the derived transport theory, a new conduction model for the electrical resistivity of polycrystalline film resitors has been developed by incorporating the effects of carrier trapping and dopant segregation in the grain boundaries. Moreover, an empirical formula for the coefficient of the dopant-segregation effects has been proposed, which enables us to predict the dependence of the electrical resistivity of phosphorus-and arsenic-doped polycrystalline silicon films on thermal annealing temperature. Phosphorus-doped polycrystalline silicon resistors have been fabricated by using ion-implantation with doses ranged from 1.6 × 10 11 to 5 × 10 15/cm 2. The dependence of the electrical resistivity on doping concentration and temperature have been measured and shown to be in good agreement with the results of computer simulations. In addition, computer simulations for boron-and arsenic-doped polycrystalline silicon resistors have also been performed and shown to be consistent with the experimental results published by previous authors.

  2. Annealing of polycrystalline thin film silicon solar cells in water vapour at sub-atmospheric pressures

    Czech Academy of Sciences Publication Activity Database

    Pikna, Peter; Píč, Vlastimil; Benda, V.; Fejfar, Antonín

    2014-01-01

    Roč. 54, č. 5 (2014), s. 341-347 ISSN 1210-2709 R&D Projects: GA MŠk 7E10061 EU Projects: European Commission(XE) 240826 - PolySiMode Grant - others:AVČR(CZ) M100101216 Institutional support: RVO:68378271 Keywords : passivation * water vapour * thin film solar cell * polycrystalline silicon (poly-Si) * multicrys- talline silicon (m-Si) * Suns-VOC Subject RIV: JE - Non-nuclear Energetics, Energy Consumption ; Use

  3. Large-grain polycrystalline silicon film by sequential lateral solidification on a plastic substrate

    International Nuclear Information System (INIS)

    Kim, Yong-Hae; Chung, Choong-Heui; Yun, Sun Jin; Moon, Jaehyun; Park, Dong-Jin; Kim, Dae-Won; Lim, Jung Wook; Song, Yoon-Ho; Lee, Jin Ho

    2005-01-01

    A large-grain polycrystalline silicon film was obtained on a plastic substrate by sequential lateral solidification. With various combinations of sputtering powers and Ar working gas pressures, the conditions for producing dense amorphous silicon (a-Si) and SiO 2 films were optimized. The successful crystallization of the a-Si film is attributed to the production of a dense a-Si film that has low argon content and can endure high-intensity laser irradiation

  4. Carrier transport in polycrystalline silicon thin films solar cells grown on a highly textured structure

    Czech Academy of Sciences Publication Activity Database

    Honda, Shinya; Takakura, H.; Hamakawa, Y.; Muhida, R.; Kawamura, T.; Harano, T.; Toyama, T.; Okamoto, H.

    2004-01-01

    Roč. 43, 9A (2004), s. 5955-5959 ISSN 0021-4922 Institutional research plan: CEZ:AV0Z1010914 Keywords : polycrystalline silicon thin film * solar cells * substrate texture Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.142, year: 2004

  5. Activation of boron and phosphorus atoms implanted in polycrystalline silicon films at low temperatures

    International Nuclear Information System (INIS)

    Andoh, Nobuyuki; Sameshima, Toshiyuki; Andoh, Yasunori

    2005-01-01

    Phosphorus atoms implanted in laser crystallized polycrystalline silicon films were activated by a heat treatment in air at 260 deg. C for 1, 3 and 24 h. Analysis of ultraviolet reflectivity of phosphorus-doped silicon films implanted by ion doping method at 4 keV revealed that the thickness of the top disordered layer formed by ion bombardment was 6 nm. It is reduced to 4 nm by a 3 h heat treatment at 260 deg. C by recrystallization of disordered region. The electrical conductance of silicon films implanted increased to 1.7x10 5 S/sq after 3 h heat treatment

  6. Fiscal 2000 achievement report. Research and development of fast-acting innovative energy-environment technology (Development of fast-acting high-efficiency solar cell technology - Development of high-quality ingot manufacturing technology); 2000 nendo shin energy sangyo gijutsu sogo kaihatsu kiko itaku kenkyu gyomu seika hokokusho. Sokkoteki kakushinteki energy kankyo gijutsu kenkyu kaihatsu (Sokkogata kokoritsu taiyo denchi gijutsu kaihatsu - Kohinshitsu ingot seizo gijutsu kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2001-03-01

    Research and development was conducted of a technology for manufacturing an ultrathin polycrystalline silicon solar cell capable of efficiency enhancement and cost reduction earlier than the types of polycrystalline solar cells now available on the market. In this fiscal year, a silicon melt/solidification experimenting apparatus was built for manufacturing high-quality silicon ingots. Using an apparatus with its performance similar to the newly built one, a preliminary experiment was conducted involving high-purity silicon ingot manufacturing. In the experiment, boron was added to 75 kg of silicon for semiconductor devices so that its resistivity may be 0.5 ohm-cm. The silicon was melted in a quartz mold, and then subjected to unidirectional coagulation at 0.13 mm/min that started at the bottom to proceed upward. The result was a silicon ingot 44 cm times 44 cm times 17 cm (height). The ingot thus obtained exhibited 0.4-0.8 ohm-cm in resistivity distribution. Solar cells produced from the ingot showed a conversion rate of 16.9%. (NEDO)

  7. Tungsten silicide contacts to polycrystalline silicon and silicon-germanium alloys

    International Nuclear Information System (INIS)

    Srinivasan, G.; Bain, M.F.; Bhattacharyya, S.; Baine, P.; Armstrong, B.M.; Gamble, H.S.; McNeill, D.W.

    2004-01-01

    Silicon-germanium alloy layers will be employed in the source-drain engineering of future MOS transistors. The use of this technology offers advantages in reducing series resistance and decreasing junction depth resulting in reduction in punch-through and SCE problems. The contact resistance of metal or metal silicides to the raised source-drain material is a serious issue at sub-micron dimensions and must be minimised. In this work, tungsten silicide produced by chemical vapour deposition has been investigated as a contact metallization scheme to both boron and phosphorus doped polycrystalline Si 1- x Ge x , with 0 ≤x ≤ 0.3. Cross bridge Kelvin resistor (CKBR) structures were fabricated incorporating CVD WSi 2 and polycrystalline SiGe. Tungsten silicide contacts to control polysilicon CKBR structures have been shown to be of high quality with specific contact resistance ρ c values 3 x 10 -7 ohm cm 2 and 6 x 10 -7 ohm cm 2 obtained to boron and phosphorus implanted samples respectively. The SiGe CKBR structures show that the inclusion of Ge yields a reduction in ρ c for both dopant types. The boron doped SiGe exhibits a reduction in ρ c from 3 x 10 -7 to 5 x 10 -8 ohm cm 2 as Ge fraction is increased from 0 to 0.3. The reduction in ρ c has been shown to be due to (i) the lowering of the tungsten silicide Schottky barrier height to p-type SiGe resulting from the energy band gap reduction, and (ii) increased activation of the implanted boron with increased Ge fraction. The phosphorus implanted samples show less sensitivity of ρ c to Ge fraction with a lowest value in this work of 3 x 10 -7 ohm cm 2 for a Ge fraction of 0.3. The reduction in specific contact resistance to the phosphorus implanted samples has been shown to be due to increased dopant activation alone

  8. Low temperature magnetron sputter deposition of polycrystalline silicon thin films using high flux ion bombardment

    International Nuclear Information System (INIS)

    Gerbi, Jennifer E.; Abelson, John R.

    2007-01-01

    We demonstrate that the microstructure of polycrystalline silicon thin films depends strongly on the flux of low energy ions that bombard the growth surface during magnetron sputter deposition. The deposition system is equipped with external electromagnetic coils which, through the unbalanced magnetron effect, provide direct control of the ion flux independent of the ion energy. We report the influence of low energy ( + on the low temperature ( + ions to silicon neutrals (J + /J 0 ) during growth by an order of magnitude (from 3 to 30) enables the direct nucleation of polycrystalline Si on glass and SiO 2 coated Si at temperatures below 400 degree sign C. We discuss possible mechanisms for this enhancement of crystalline microstructure, including the roles of enhanced adatom mobility and the formation of shallow, mobile defects

  9. Recent developments in multi-wire fixed abrasive slicing technique (FAST). [for low cost silicon wafer production from ingots

    Science.gov (United States)

    Schmid, F.; Khattak, C. P.; Smith, M. B.; Lynch, L. D.

    1982-01-01

    Slicing is an important processing step for all technologies based on the use of ingots. A comparison of the economics of three slicing techniques shows that the fixed abrasive slicing technique (FAST) is superior to the internal diameter (ID) and the multiblade slurry (MBS) techniques. Factors affecting contact length are discussed, taking into account kerf width, rocking angle, ingot size, and surface speed. Aspects of blade development are also considered. A high concentration of diamonds on wire has been obtained in wire packs usd for FAST slicing. The material removal rate was found to be directly proportional to the pressure at the diamond tips.

  10. Laser-beam-induced current mapping evaluation of porous silicon-based passivation in polycrystalline silicon solar cells

    Energy Technology Data Exchange (ETDEWEB)

    Rabha, M. Ben; Bessais, B. [Laboratoire de Nanomateriaux et des Systemes pour l' Energie, Centre de Recherches et des Technologies de l' Energie - Technopole de Borj-Cedria BP 95, 2050 Hammam-Lif (Tunisia); Dimassi, W.; Bouaicha, M.; Ezzaouia, H. [Laboratoire de photovoltaique, des semiconducteurs et des nanostructures, Centre de Recherches et des Technologies de l' Energie - Technopole de Borj-Cedria BP 95, 2050 Hammam-Lif (Tunisia)

    2009-05-15

    In the present work, we report on the effect of introducing a superficial porous silicon (PS) layer on the performance of polycrystalline silicon (pc-Si) solar cells. Laser-beam-induced current (LBIC) mapping shows that the PS treatment on the emitter of pc-Si solar cells improves their quantum response and reduce the grain boundaries (GBs) activity. After the porous silicon treatment, mapping investigation shows an enhancement of the LBIC and the internal quantum efficiency (IQE), due to an improvement of the minority carrier diffusion length and the passivation of recombination centers at the GBs as compared to the reference substrate. It was quantitatively shown that porous silicon treatment can passivate both the grains and GBs. (author)

  11. Effects of deep impurities and structural defects in polycrystalline silicon for photovoltaic applications

    International Nuclear Information System (INIS)

    Galluzzi, F.; Scafe, E.; Beghi, M.; Fossati, S.; Tincani, M.; Pizzini, S.

    1985-01-01

    An extensive experimental study of minority carrier recombination in CZ grown polycrystalline silicon intentionally doped with metallic impurities (Ti, V, Fe, Cr, Zr) is reported. Experimental values of average diffusion lengths have been compared with values calculated by a simple model of carrier recombination, taking into account the effects of impurities, grain boundaries and intragrain crystal defects. The results are fairly consistent and allow the determination of threshold densities for structural defects and deep impurities. The author's analysis gives a simple quantitative description of recombination processes in solar-grade silicon, as far as the average behaviour is concerned

  12. Numerical analysis of thermal stress and dislocation density distributions in large size multi-crystalline silicon ingots during the seeded growth process

    Science.gov (United States)

    Nguyen, Thi Hoai Thu; Chen, Jyh-Chen; Hu, Chieh; Chen, Chun-Hung; Huang, Yen-Hao; Lin, Huang-Wei; Yu, Andy; Hsu, Bruce

    2017-06-01

    In this study, a global transient numerical simulation of silicon growth from the beginning of the solidification process until the end of the cooling process is carried out modeling the growth of an 800 kg ingot in an industrial seeded directional solidification furnace. The standard furnace is modified by the addition of insulating blocks in the hot zone. The simulation results show that there is a significant decrease in the thermal stress and dislocation density in the modified model as compared to the standard one (a maximal decrease of 23% and 75% along the center line of ingot for thermal stress and dislocation density, respectively). This modification reduces the heating power consumption for solidification of the silicon melt by about 17% and shortens the growth time by about 2.5 h. Moreover, it is found that adjusting the operating conditions of modified model to obtain the lower growth rate during the early stages of the solidification process can lower dislocation density and total heater power.

  13. Polycrystalline indium phosphide on silicon by indium assisted growth in hydride vapor phase epitaxy

    Energy Technology Data Exchange (ETDEWEB)

    Metaferia, Wondwosen; Sun, Yan-Ting, E-mail: yasun@kth.se; Lourdudoss, Sebastian [Laboratory of Semiconductor Materials, Department of Materials and Nano Physics, KTH—Royal Institute of Technology, Electrum 229, 164 40 Kista (Sweden); Pietralunga, Silvia M. [CNR-Institute for Photonics and Nanotechnologies, P. Leonardo da Vinci, 32 20133 Milano (Italy); Zani, Maurizio; Tagliaferri, Alberto [Department of Physics Politecnico di Milano, P. Leonardo da Vinci, 32 20133 Milano (Italy)

    2014-07-21

    Polycrystalline InP was grown on Si(001) and Si(111) substrates by using indium (In) metal as a starting material in hydride vapor phase epitaxy (HVPE) reactor. In metal was deposited on silicon substrates by thermal evaporation technique. The deposited In resulted in islands of different size and was found to be polycrystalline in nature. Different growth experiments of growing InP were performed, and the growth mechanism was investigated. Atomic force microscopy and scanning electron microscopy for morphological investigation, Scanning Auger microscopy for surface and compositional analyses, powder X-ray diffraction for crystallinity, and micro photoluminescence for optical quality assessment were conducted. It is shown that the growth starts first by phosphidisation of the In islands to InP followed by subsequent selective deposition of InP in HVPE regardless of the Si substrate orientation. Polycrystalline InP of large grain size is achieved and the growth rate as high as 21 μm/h is obtained on both substrates. Sulfur doping of the polycrystalline InP was investigated by growing alternating layers of sulfur doped and unintentionally doped InP for equal interval of time. These layers could be delineated by stain etching showing that enough amount of sulfur can be incorporated. Grains of large lateral dimension up to 3 μm polycrystalline InP on Si with good morphological and optical quality is obtained. The process is generic and it can also be applied for the growth of other polycrystalline III–V semiconductor layers on low cost and flexible substrates for solar cell applications.

  14. Effect of doping on the modification of polycrystalline silicon by spontaneous reduction of diazonium salts

    Energy Technology Data Exchange (ETDEWEB)

    Girard, A.; Coulon, N. [UMR-CNRS 6164, Institut d’Electronique et de Télécommunications de Rennes, Université de Rennes 1, Campus de Beaulieu, 35042 Rennes cedex (France); Cardinaud, C. [UMR-CNRS 6502, Institut des Matériaux Jean Rouxel, Université de Nantes, 2 rue de la Houssinière, BP32229, F-44322 Nantes cedex 3 (France); Mohammed-Brahim, T. [UMR-CNRS 6164, Institut d’Electronique et de Télécommunications de Rennes, Université de Rennes 1, Campus de Beaulieu, 35042 Rennes cedex (France); Geneste, F., E-mail: Florence.Geneste@univ-rennes1.fr [UMR-CNRS 6226, Institut des Sciences Chimiques de Rennes, Equipe MaCSE, Université de Rennes 1, Campus de Beaulieu, 35042 Rennes cedex (France)

    2014-09-30

    Highlights: • Spontaneous grafting of aryl diazonium salts on polycrystalline silicon surfaces. • Effect of the nature and level of doping on the efficiency of the functionalization. • The grafting process was more efficient on PolySi substrates than on monosilicon. • Influence of the crystal structure and grain boundaries on the modification procedure. • Role of the reducing power of the substrate on the grafting procedure. - Abstract: The chemical modification of doped polycrystalline silicon materials (N+, N++ and P++) and silicon (1 0 0) and (1 1 1) used as references is investigated by spontaneous reduction of diazonium salts. The effectiveness of the grafting process on all polySi surfaces is shown by AFM and XPS analyses. The effect of substrate doping on the efficiency of the electrografting process is compared by using the thicknesses of the deposited organic films. For a better accuracy, two methods are used to estimate the thicknesses: XPS and the coupling of a O{sub 2} plasma etching with AFM measurement. Structural characteristics of the poly-Si films were investigated by Scanning Electron Microscopy and X-ray diffraction to find a correlation between the structure of the material and its reactivity. Different parameters that could have an impact on the efficiency of the grafting procedure are discussed. The observed differences between differently doped silicon surfaces is rather limited, this is in agreement with the radical character of the reacting species.

  15. Effect of doping on the modification of polycrystalline silicon by spontaneous reduction of diazonium salts

    International Nuclear Information System (INIS)

    Girard, A.; Coulon, N.; Cardinaud, C.; Mohammed-Brahim, T.; Geneste, F.

    2014-01-01

    Highlights: • Spontaneous grafting of aryl diazonium salts on polycrystalline silicon surfaces. • Effect of the nature and level of doping on the efficiency of the functionalization. • The grafting process was more efficient on PolySi substrates than on monosilicon. • Influence of the crystal structure and grain boundaries on the modification procedure. • Role of the reducing power of the substrate on the grafting procedure. - Abstract: The chemical modification of doped polycrystalline silicon materials (N+, N++ and P++) and silicon (1 0 0) and (1 1 1) used as references is investigated by spontaneous reduction of diazonium salts. The effectiveness of the grafting process on all polySi surfaces is shown by AFM and XPS analyses. The effect of substrate doping on the efficiency of the electrografting process is compared by using the thicknesses of the deposited organic films. For a better accuracy, two methods are used to estimate the thicknesses: XPS and the coupling of a O 2 plasma etching with AFM measurement. Structural characteristics of the poly-Si films were investigated by Scanning Electron Microscopy and X-ray diffraction to find a correlation between the structure of the material and its reactivity. Different parameters that could have an impact on the efficiency of the grafting procedure are discussed. The observed differences between differently doped silicon surfaces is rather limited, this is in agreement with the radical character of the reacting species

  16. Resistivity and morphology of TiSi2 formed on Xe+-implanted polycrystalline silicon

    International Nuclear Information System (INIS)

    Kuwano, H.; Phillips, J.R.; Mayer, J.W.

    1990-01-01

    Xe ion irradiation of polycrystalline silicon before Ti deposition is found to affect subsequent silicide formation. Silicide films were prepared by implanting 60, 100, or 240 keV Xe + ions into 500-nm-thick undoped polycrystalline silicon before depositing Ti and annealing in vacuum. Preimplantation altered the subsequent silicide resistivity, x-ray diffraction patterns, and morphology as compared to films prepared on unimplanted polycrystalline Si substrates. We found that minimal TiSi 2 resistivities were achieved at lower temperatures with preimplantation, indicating that the Xe-implanted substrate promotes a lower temperature transition from the metastable C49 phase to the low-resistivity equilibrium C54 phase of TiSi 2 . X-ray diffraction results confirmed the lower temperature formation of the C54 phase with preimplantation. Low-temperature annealing (650 degree C, 30 min) of 6x10 16 cm -2 , 240 keV Xe + -implanted samples yielded low-resistivity (∼22 μΩ cm) silicide films, while simultaneously annealed samples without preimplantation had resistivity five times higher. Lower doses were effective at lower implant energies, with low resistivity achieved after 725 degree C, 30 min annealing for 2x10 15 cm -2 , 60 keV Xe + preimplantation

  17. Very high-cycle fatigue failure in micron-scale polycrystalline silicon films : Effects of environment and surface oxide thickness

    NARCIS (Netherlands)

    Alsem, D. H.; Boyce, B. L.; Stach, E. A.; De Hosson, J. Th. M.; Ritchie, R. O.

    2007-01-01

    Fatigue failure in micron-scale polycrystalline silicon structural films, a phenomenon that is not observed in bulk silicon, can severely impact the durability and reliability of microelectromechanical system devices. Despite several studies on the very high-cycle fatigue behavior of these films (up

  18. Methods of removal of defects arising at liquid etching of polycrystalline silicon

    Directory of Open Access Journals (Sweden)

    Ivanchykou A. E.

    2008-02-01

    Full Text Available The paper presents a model of generation of defects having the form of spots on the surface of the polycrystalline silicon during processing of semiconductor wafers with hydrofluoric acid based etchant, and a model of removal of such defects in chemical solutions. The authors investigate how the centrifuge speed during drying and the relief of structures, produced on the plate, effect the number of defects. It is shown that there is a possibility to remove defects by chemical treatment in the peroxide-ammonia solutions (PAS and also by sequence of chemical cleaning in Karo mixture, SiO2 etching and treatment in PAS.

  19. Highly -oriented growth of polycrystalline silicon films on glass by pulsed magnetron sputtering

    International Nuclear Information System (INIS)

    Reinig, P.; Selle, B.; Fenske, F.; Fuhs, W.; Alex, V.; Birkholz, M.

    2002-01-01

    Nominally undoped polycrystalline silicon (poly-Si) thin films were deposited on glass at 450 deg. C at high deposition rate (>100 nm/min) by pulsed dc magnetron sputtering. The pulse frequency was found to have a significant influence on the preferred grain orientation. The x-ray diffraction pattern exhibits a strong enhancement of the (400) reflex with increasing pulse frequency. The quantitative evaluation reveals that over 90% of the grains are oriented. The observed change in preferred grain orientation in poly-Si films at low temperatures is associated with concurrent ion bombardment of the growing film

  20. High-temperature laser annealing for thin film polycrystalline silicon solar cell on glass substrate

    Science.gov (United States)

    Chowdhury, A.; Schneider, J.; Dore, J.; Mermet, F.; Slaoui, A.

    2012-06-01

    Thin film polycrystalline silicon films grown on glass substrate were irradiated with an infrared continuous wave laser for defects annealing and/or dopants activation. The samples were uniformly scanned using an attachment with the laser system. Substrate temperature, scan speed and laser power were varied to find suitable laser annealing conditions. The Raman spectroscopy and Suns- V oc analysis were carried out to qualify the films quality after laser annealing. A maximum enhancement of the open circuit voltage V oc of about 100 mV is obtained after laser annealing of as-grown polysilicon structures. A strong correlation was found between the full width half maximum of the Si crystalline peak and V oc. It is interpreted as due to defects annealing as well as to dopants activation in the absorbing silicon layer. The maximum V oc reached is 485 mV after laser treatment and plasma hydrogenation, thanks to defects passivation.

  1. Improved contact metallization for high efficiency EFG polycrystalline silicon solar cells

    International Nuclear Information System (INIS)

    Dube, C.E.; Gonsiorawski, R.C.

    1990-01-01

    Improvements in the performance of polycrystalline silicon solar cells based on a novel, laser patterned contact process are described. Small lots of cells having an average conversion efficiency of 14 + %, with several cells approaching 15%, are reported for cells of 45 cm 2 area. The high efficiency contact design is based on YAG laser patterning of the silicon nitride anti-reflection coating. The Cu metallization is done using light-induced plating, with the cell providing the driving voltage for the plating process. The Cu electrodeposits into the laser defined windows in the AR coating for reduced contact area, following which the Cu bridges on top of the Ar coating to form a continuous finger pattern. The higher cell conversion efficiency is attributed to reduced shadow loss, higher junction quality, and reduced metal-semiconductor interfacial area

  2. Silicon Ingot Casting - Heat Exchanger Method Multi-wire Slicing - Fixed Abrasive Slicing Technique. Phase 3 Silicon Sheet Growth Development for the Large Area Sheet Task of the Low-cost Solar Array Project

    Science.gov (United States)

    Schmid, F.; Khattak, C. P.

    1979-01-01

    Several 20 cm diameter silicon ingots, up to 6.3 kg. were cast with good crystallinity. The graphite heat zone can be purified by heating it to high temperatures in vacuum. This is important in reducing costs and purification of large parts. Electroplated wires with 45 um synthetic diamonds and 30 um natural diamonds showed good cutting efficiency and lifetime. During slicing of a 10 cm x 10 cm workpiece, jerky motion occurred in the feed and rocking mechanisms. This problem is corrected and modifications were made to reduce the weight of the bladeheat by 50%.

  3. Complex boron redistribution kinetics in strongly doped polycrystalline-silicon/nitrogen-doped-silicon thin bi-layers

    Energy Technology Data Exchange (ETDEWEB)

    Abadli, S. [Department of Electrical Engineering, University Aout 1955, Skikda, 21000 (Algeria); LEMEAMED, Department of Electronics, University Mentouri, Constantine, 25000 (Algeria); Mansour, F. [LEMEAMED, Department of Electronics, University Mentouri, Constantine, 25000 (Algeria); Pereira, E. Bedel [CNRS-LAAS, 7 avenue du colonel Roche, 31077 Toulouse (France)

    2012-10-15

    We have investigated the complex behaviour of boron (B) redistribution process via silicon thin bi-layers interface. It concerns the instantaneous kinetics of B transfer, trapping, clustering and segregation during the thermal B activation annealing. The used silicon bi-layers have been obtained by low pressure chemical vapor deposition (LPCVD) method at 480 C, by using in-situ nitrogen-doped-silicon (NiDoS) layer and strongly B doped polycrystalline-silicon (P{sup +}) layer. To avoid long-range B redistributions, thermal annealing was carried out at relatively low-temperatures (600 C and 700 C) for various times ranging between 30 min and 2 h. To investigate the experimental secondary ion mass spectroscopy (SIMS) doping profiles, a redistribution model well adapted to the particular structure of two thin layers and to the effects of strong-concentrations has been established. The good adjustment of the simulated profiles with the experimental SIMS profiles allowed a fundamental understanding about the instantaneous physical phenomena giving and disturbing the complex B redistribution profiles-shoulders. The increasing kinetics of the B peak concentration near the bi-layers interface is well reproduced by the established model. (Copyright copyright 2012 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim)

  4. Methods of optimising ion beam induced charge collection of polycrystalline silicon photovoltaic cells

    International Nuclear Information System (INIS)

    Witham, L.C.G.; Jamieson, D.N.; Bardos, R.A.

    1998-01-01

    Ion Beam Induced Charge (IBIC) is a valuable method for the mapping of charge carrier transport and recombination in silicon solar cells. However performing IBIC analysis of polycrystalline silicon solar cells is problematic in a manner unlike previous uses of IBIC on silicon-based electronic devices. Typical solar cells have a surface area of several square centimeters and a p-n junction thickness of only few microns. This means the cell has a large junction capacitance in the many nanoFarads range which leads to a large amount of noise on the preamplifier inputs which typically swamps the transient IBIC signal. The normal method of improving the signal-to-noise (S/N) ratio by biasing the junction is impractical for these cells as the low-quality silicon used leads to a large leakage current across the device. We present several experimental techniques which improve the S/N ratio which when used together should make IBIC analysis of many low crystalline quality devices a viable and reliable procedure. (authors)

  5. Substrate bias effect on crystallinity of polycrystalline silicon thin films prepared by pulsed ion-beam evaporation method

    Energy Technology Data Exchange (ETDEWEB)

    Ali, Fazlat; Gunji, Michiharu; Yang, Sung-Chae; Suzuki, Tsuneo; Suematsu, Hisayuki; Jiang, Weihua; Yatsui, Kiyoshi [Nagaoka Univ. of Technology, Extreme Energy-Density Research Inst., Nagaoka, Niigata (Japan)

    2002-06-01

    The deposition of polycrystalline silicon thin films has been tried by a pulsed ion-beam evaporation method, where high crystallinity and deposition rate have been achieved without heating the substrate. The crystallinity and the deposition rate were improved by applying bias voltage to the substrate, where instantaneous substrate heating might have occurred by ion-bombardment. (author)

  6. Substrate bias effect on crystallinity of polycrystalline silicon thin films prepared by pulsed ion-beam evaporation method

    International Nuclear Information System (INIS)

    Ali, Fazlat; Gunji, Michiharu; Yang, Sung-Chae; Suzuki, Tsuneo; Suematsu, Hisayuki; Jiang, Weihua; Yatsui, Kiyoshi

    2002-01-01

    The deposition of polycrystalline silicon thin films has been tried by a pulsed ion-beam evaporation method, where high crystallinity and deposition rate have been achieved without heating the substrate. The crystallinity and the deposition rate were improved by applying bias voltage to the substrate, where instantaneous substrate heating might have occurred by ion-bombardment. (author)

  7. Effect of doping on the modification of polycrystalline silicon by spontaneous reduction of diazonium salts

    Science.gov (United States)

    Girard, A.; Coulon, N.; Cardinaud, C.; Mohammed-Brahim, T.; Geneste, F.

    2014-09-01

    The chemical modification of doped polycrystalline silicon materials (N+, N++ and P++) and silicon (1 0 0) and (1 1 1) used as references is investigated by spontaneous reduction of diazonium salts. The effectiveness of the grafting process on all polySi surfaces is shown by AFM and XPS analyses. The effect of substrate doping on the efficiency of the electrografting process is compared by using the thicknesses of the deposited organic films. For a better accuracy, two methods are used to estimate the thicknesses: XPS and the coupling of a O2 plasma etching with AFM measurement. Structural characteristics of the poly-Si films were investigated by Scanning Electron Microscopy and X-ray diffraction to find a correlation between the structure of the material and its reactivity. Different parameters that could have an impact on the efficiency of the grafting procedure are discussed. The observed differences between differently doped silicon surfaces is rather limited, this is in agreement with the radical character of the reacting species.

  8. Fatigue characteristics of polycrystalline silicon thin-film membrane and its dependence on humidity

    International Nuclear Information System (INIS)

    Tanemura, Tomoki; Yamashita, Shuichi; Wado, Hiroyuki; Takeuchi, Yukihiro; Tsuchiya, Toshiyuki; Tabata, Osamu

    2013-01-01

    This paper describes fatigue characteristics of a polycrystalline silicon thin-film membrane under different humidity evaluated by out-of-plane resonant vibration. The membrane, without the surface of sidewalls by patterning of photolithography and etching process, was applied to evaluate fatigue characteristics precisely against the changes in the surrounding humidity owing to narrower deviation in the fatigue lifetime. The membrane has 16 mm square-shaped multilayered films consisting of a 250 or 500 nm thick polysilicon film on silicon dioxide and silicon nitride underlying layers. A circular weight of 12 mm in diameter was placed at the center of the membrane to control the resonant frequency. Stress on the polysilicon film was generated by deforming the membrane oscillating the weight in the out-of-plane direction. The polysilicon film was fractured by fatigue damage accumulation under cyclic stress. The lifetime of the polysilicon membrane extended with lower relative humidity, especially at 5%RH. The results of the fatigue tests were well formulated with Weibull's statistics and Paris’ law. The dependence of fatigue characteristics on humidity has been quantitatively revealed for the first time. The crack growth rate indicated by the fatigue index decreased with the reduction in humidity, whereas the deviation of strength represented by the Weibull modulus was nearly constant against humidity. (paper)

  9. Study on defects and impurities in cast-grown polycrystalline silicon substrates for solar cells

    International Nuclear Information System (INIS)

    Arafune, K.; Sasaki, T.; Wakabayashi, F.; Terada, Y.; Ohshita, Y.; Yamaguchi, M.

    2006-01-01

    We focused on the defects and impurities in polycrystalline silicon substrates, which deteriorate solar cell efficiency. Comparison of the minority carrier lifetime with the grain size showed that the region with short minority carrier lifetimes did not correspond to the region with small grains. Conversely, the minority carrier lifetime decreased as the etch-pit density (EPD) increased, suggesting that the minority carrier lifetime is strongly affected by the EPD. Electron beam induced current measurements revealed that a combination of grain boundaries and point defects had high recombination activity. Regarding impurities, the interstitial oxygen concentration was relatively low compared with that in a Czochralski-grown silicon substrate, the total carbon concentration exceeded the solubility limit of silicon melt. X-ray microprobe fluorescence measurements revealed a large amount of iron in the regions where there were many etch-pits and grain boundaries with etch-pits. X-ray absorption near edge spectrum analysis revealed trapped iron in the form of oxidized iron

  10. Fluorocarbon polymer formation, characterization, and reduction in polycrystalline-silicon etching with CF4-added plasma

    International Nuclear Information System (INIS)

    Xu Songlin; Sun Zhiwen; Chen Arthur; Qian Xueyu; Podlesnik, Dragan

    2001-01-01

    Addition of CF 4 into HBr-based plasma for polycrystalline-silicon gate etching reduces the deposition of an etch byproduct, silicon oxide, onto the chamber wall but tends to generate organic polymer. In this work, a detailed study has been carried out to analyze the mechanism of polymerization and to characterize the polymer composition and quantity. The study has shown that the polymer formation is due to the F-radical depletion by H atoms dissociated from HBr. The composition of the polymer changes significantly with CF 4 concentration in the gas feed, and the polymer deposition rate depends on CF 4 % and other process conditions such as source power, bias power, and pressure. Surface temperature also affects the polymer deposition rate. Adding O 2 into the plasma can clean the organic polymer, but the O 2 amount has to be well controlled in order to prevent the formation of silicon oxide. Based on a series of tests to evaluate polymer deposition and oxide cleaning with O 2 addition, an optimized process regime in terms of O 2 -to-CF 4 ratio has been identified to simultaneously suppress the polymer and oxide deposition so that the etch process becomes self-cleaning

  11. ANNEALING OF POLYCRYSTALLINE THIN FILM SILICON SOLAR CELLS IN WATER VAPOUR AT SUB-ATMOSPHERIC PRESSURES

    Directory of Open Access Journals (Sweden)

    Peter Pikna

    2014-10-01

    Full Text Available Thin film polycrystalline silicon (poly-Si solar cells were annealed in water vapour at pressures below atmospheric pressure. PN junction of the sample was contacted by measuring probes directly in the pressure chamber filled with steam during passivation. Suns-VOC method and a Lock-in detector were used to monitor an effect of water vapour to VOC of the solar cell during whole passivation process (in-situ. Tested temperature of the sample (55°C – 110°C was constant during the procedure. Open-circuit voltage of a solar cell at these temperatures is lower than at room temperature. Nevertheless, voltage response of the solar cell to the light flash used during Suns-VOC measurements was good observable. Temperature dependences for multicrystalline wafer-based and polycrystalline thin film solar cells were measured and compared. While no significant improvement of thin film poly-Si solar cell parameters by annealing in water vapour at under-atmospheric pressures was observed up to now, in-situ observation proved required sensitivity to changing VOC at elevated temperatures during the process.

  12. THE INFLUENCE OF SUNLIGHT AND WIND ON THE POLYCRYSTALLINE SILICON MODULES

    Directory of Open Access Journals (Sweden)

    Piotr Lichograj

    2016-12-01

    Full Text Available Changing conditions have a significant impact on the efficiency and durability of photovoltaic cells. On photovoltaic modules have also influence such external factors as temperature of the module, which changes during the long exposure to light radiation, wind, pollution and the frequency of rainfall. Parameters of PV modules provided by the manufacturers differ significantly from the results achieved under natural conditions. This work presents the laboratory study on the impact of temperature of the polycrystalline silicon module to the change of generated voltage tested with no load. Research confirms the correlation of temperature increase during the long exposure to light radiation with a voltage drop. At the same time simulation of wind causes the cooling of the module and increase the voltage circuit. Further development of research on the effects of environmental conditions will allow for accurate placement optimization of photovoltaic farms.

  13. Crystallization to polycrystalline silicon thin film and simultaneous inactivation of electrical defects by underwater laser annealing

    Energy Technology Data Exchange (ETDEWEB)

    Machida, Emi [Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma, Nara 630-0192 (Japan); Research Fellowships of the Japan Society for the Promotion of Science, Japan Society for the Promotion of Science, 1-8 Chiyoda, Tokyo 102-8472 (Japan); Horita, Masahiro; Ishikawa, Yasuaki; Uraoka, Yukiharu [Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma, Nara 630-0192 (Japan); Core Research for Evolutional Science and Technology, Japan Science and Technology Agency, Honcho, Kawaguchi, Saitama 332-0012 (Japan); Ikenoue, Hiroshi [Graduate School of Information Science and Electrical Engineering, Kyushu University, 744 Motooka Nishi-ku, Fukuoka 819-0395 (Japan)

    2012-12-17

    We propose a low-temperature laser annealing method of a underwater laser annealing (WLA) for polycrystalline silicon (poly-Si) films. We performed crystallization to poly-Si films by laser irradiation in flowing deionized-water where KrF excimer laser was used for annealing. We demonstrated that the maximum value of maximum grain size of WLA samples was 1.5 {mu}m, and that of the average grain size was 2.8 times larger than that of conventional laser annealing in air (LA) samples. Moreover, WLA forms poly-Si films which show lower conductivity and larger carrier life time attributed to fewer electrical defects as compared to LA poly-Si films.

  14. Influence of metal induced crystallization parameters on the performance of polycrystalline silicon thin film transistors

    International Nuclear Information System (INIS)

    Pereira, L.; Barquinha, P.; Fortunato, E.; Martins, R.

    2005-01-01

    In this work, metal induced crystallization using nickel was employed to obtain polycrystalline silicon by crystallization of amorphous films for thin film transistor applications. The devices were produced through only one lithographic process with a bottom gate configuration using a new gate dielectric consisting of a multi-layer of aluminum oxide/titanium oxide produced by atomic layer deposition. The best results were obtained for TFTs with the active layer of poly-Si crystallized for 20 h at 500 deg. C using a nickel layer of 0.5 nm where the effective mobility is 45.5 cm 2 V -1 s -1 . The threshold voltage, the on/off current ratio and the sub-threshold voltage are, respectively, 11.9 V, 5.55x10 4 and 2.49 V/dec

  15. Control of the Gas Flow in an Industrial Directional Solidification Furnace for Production of High Purity Multicrystalline Silicon Ingots

    Directory of Open Access Journals (Sweden)

    Lijun Liu

    2015-01-01

    Full Text Available A crucible cover was designed as gas guidance to control the gas flow in an industrial directional solidification furnace for producing high purity multicrystalline silicon. Three cover designs were compared to investigate their effect on impurity transport in the furnace and contamination of the silicon melt. Global simulations of coupled oxygen (O and carbon (C transport were carried out to predict the SiO and CO gases in the furnace as well as the O and C distributions in the silicon melt. Cases with and without chemical reaction on the cover surfaces were investigated. It was found that the cover design has little effect on the O concentration in the silicon melt; however, it significantly influences CO gas transport in the furnace chamber and C contamination in the melt. For covers made of metal or with a coating on their surfaces, an optimal cover design can produce a silicon melt free of C contamination. Even for a graphite cover without a coating, the carbon concentration in the silicon melt can be reduced by one order of magnitude. The simulation results demonstrate a method to control the contamination of C impurities in an industrial directional solidification furnace by crucible cover design.

  16. Study of Nitrogen Effect on the Boron Diffusion during Heat Treatment in Polycrystalline Silicon/Nitrogen-Doped Silicon Thin Films

    Science.gov (United States)

    Saci, Lynda; Mahamdi, Ramdane; Mansour, Farida; Boucher, Jonathan; Collet, Maéva; Bedel Pereira, Eléna; Temple-Boyer, Pierre

    2011-05-01

    The present paper studies the boron (B) diffusion in nitrogen (N) doped amorphous silicon (a-Si) layer in original bi-layer B-doped polycrystalline silicon (poly-Si)/in-situ N-doped Si layers (NIDOS) thin films deposited by low pressure chemical vapor deposition (LPCVD) technique. The B diffusion in the NIDOS layer was investigated by secondary ion mass spectrometry (SIMS) and Fourier transform infrared spectroscopy (FTIR) analysis. A new extended diffusion model is proposed to fit the SIMS profile of the bi-layer films. This model introduces new terms which take into account the effect of N concentration on the complex diffusion phenomena of B atoms in bi-layer films. SIMS results show that B diffusion does not exceed one third of NIDOS layer thickness after annealing. The reduction of the B diffusion in the NIDOS layer is due to the formation of complex B-N as shown by infrared absorption measurements. Electrical measurements using four-probe and Hall effect techniques show the good conductivity of the B-doped poly-Si layer after annealing treatment.

  17. Influence of polycrystalline silicon layer on flow through «metal — p-Si» contact

    Directory of Open Access Journals (Sweden)

    Smyntyna V. A.

    2011-11-01

    Full Text Available Based on the results of investigations of charge transport in the "metal — p-Si" contacts with different thickness of polycrystalline p-Si layer the mechanisms of charge transport through such structures are shown. It is established that with increasing thickness of the layer of polycrystalline p-Si current transport mechanism changes from a double injection into the drift-diffusion. This change is due to an increase in the drift current component in the space charge zone of "metal — p-Si" contact, which arises as a result of increased surface density of scattering barriers, which are localized at the boundaries of neighboring silicon polycrystals.

  18. Application of the chemical vapor-etching in polycrystalline silicon solar cells

    International Nuclear Information System (INIS)

    Ben Rabha, M.; Saadoun, M.; Boujmil, M.F.; Bessais, B.; Ezzaouia, H.; Bennaceur, R.

    2005-01-01

    This paper reports a study of the application of chemical vapor-etching (CVE) for the rear surface and in the emitter of polycrystalline silicon (pc-Si) solar cells. The CVE technique consists of exposing pc-Si wafers to a mixture of HF/HNO 3 . This technique is used to groove the rear surface of the pc-Si wafers for acid vapors rich in HNO 3 (HNO 3 /HF > 1/4), in order to realize rear-buried metallic contacts (RBMC) and the formation of a porous silicon (PS) layer on the frontal surface of the cell for volume ratio of HNO 3 /HF = 1/7. A significant increase of the spectral response in the long wavelength range was observed when a RBMC is formed. This increase was attributed to the reduction of the effective thickness of the base of the cells and grain boundary Al gettering. The achievement of a PS layer on the emitter of the pc-Si cells passivates the surface and reduces the reflectivity. The dark I-V characteristics of pc-Si cells with emitter-based PS show an important reduction of the reverse current together with an improvement of the rectifying behaviour. The I-V characteristic under AM1.5 illumination shows an enhancement of both short circuit current density and fill factor. The internal quantum efficiency is improved, particularly in the short wavelengths region

  19. Polycrystalline silicon ring resonator photodiodes in a bulk complementary metal-oxide-semiconductor process.

    Science.gov (United States)

    Mehta, Karan K; Orcutt, Jason S; Shainline, Jeffrey M; Tehar-Zahav, Ofer; Sternberg, Zvi; Meade, Roy; Popović, Miloš A; Ram, Rajeev J

    2014-02-15

    We present measurements on resonant photodetectors utilizing sub-bandgap absorption in polycrystalline silicon ring resonators, in which light is localized in the intrinsic region of a p+/p/i/n/n+ diode. The devices, operating both at λ=1280 and λ=1550  nm and fabricated in a complementary metal-oxide-semiconductor (CMOS) dynamic random-access memory emulation process, exhibit detection quantum efficiencies around 20% and few-gigahertz response bandwidths. We observe this performance at low reverse biases in the range of a few volts and in devices with dark currents below 50 pA at 10 V. These results demonstrate that such photodetector behavior, previously reported by Preston et al. [Opt. Lett. 36, 52 (2011)], is achievable in bulk CMOS processes, with significant improvements with respect to the previous work in quantum efficiency, dark current, linearity, bandwidth, and operating bias due to additional midlevel doping implants and different material deposition. The present work thus offers a robust realization of a fully CMOS-fabricated all-silicon photodetector functional across a wide wavelength range.

  20. Solid phase crystallized polycrystalline thin-films on glass from evaporated silicon for photovoltaic applications

    International Nuclear Information System (INIS)

    Song Dengyuan; Inns, Daniel; Straub, Axel; Terry, Mason L.; Campbell, Patrick; Aberle, Armin G.

    2006-01-01

    Polycrystalline silicon (poly-Si) thin-films are made on planar and textured glass substrates by solid phase crystallization (SPC) of in situ doped amorphous silicon (a-Si) deposited by electron-beam evaporation. These materials are referred to by us as EVA materials (SPC of evaporated a-Si). The properties of EVA poly-Si films are characterised by Raman microscopy, transmission electron microscopy, and X-ray diffraction. A narrow and symmetrical Raman peak at a wave number of about 520 cm -1 is observed for all samples, showing that the films are fully crystallized. X-ray diffraction (XRD) reveals that the films are preferentially (111)-oriented. Furthermore, the full width at half maximum of the dominant (111) XRD peaks indicates that the structural quality of the films is affected by the a-Si deposition temperature and the surface morphology of the glass substrates. A-Si deposition at 200 instead of 400 deg. C leads to an enhanced poly-Si grain size. On textured glass, the addition of a SiN barrier layer between the glass and the Si improves the poly-Si material quality. No such effect occurs on planar glass. Mesa-type solar cells are made from these EVA films on planar and textured glass. A strong correlation between the cells' current-voltage characteristics and their crystalline material quality is observed

  1. Development of advanced Czochralski Growth Process to produce low cost 150 KG silicon ingots from a single crucible for technology readiness

    Science.gov (United States)

    1981-01-01

    The goals in this program for advanced czochralski growth process to produce low cost 150 kg silicon ingots from a single crucible for technology readiness are outlined. To provide a modified CG2000 crystal power capable of pulling a minimum of five crystals, each of approximately 30 kg in weight, 150 mm diameter from a single crucible with periodic melt replenishment. Crystals to have: resistivity of 1 to 3 ohm cm, p-type; dislocation density below 1- to the 6th power per cm; orientation (100); after growth yield of greater than 90%. Growth throughput of greater than 2.5 kg per hour of machine operation using a radiation shield. Prototype equipment suitable for use as a production facility. The overall cost goal is $.70 per peak watt by 1986. To accomplish these goals, the modified CG2000 grower and development program includes: (1) increased automation with a microprocessor based control system; (2) sensors development which will increase the capability of the automatic controls system, and provide technology transfer of the developed systems.

  2. Comparison of the nonradiative deep levels in silicon solar cells made of monocrystalline, polycrystalline and amorphous silicon using deep level transient spectroscopy (DLTS)

    International Nuclear Information System (INIS)

    Hammadeh, H.; Darwich, R.

    2005-03-01

    The aim of this work is to study the defects in solar cells fabricated from crystalline, polycrystalline and amorphous silicon. Using Deep Level Transient Spectroscopy technique, (DLTS), we have determined their activation energies, concentrations and their effect on the solar cell efficiency. Our results show a DLTS peak in crystalline silicon which we could attribute to tow peaks originating from iron contamination. In the polycrystalline based solar cells we observed a series of non conventional DLTS peaks while in amorphous silicon we observed a peak using low measurement frequencies (between 8 kHz and 20 kHz). We studied these defects and determined their activation energies as well as the capture cross section for one of them. We suggest a possible configuration of these defects. We cannot able to study the effect of these defects on the solar cell efficiency because we have not the experimental set-up which measure the solar cell efficiency. (Authors)

  3. Disposal of metal fragments released during polycrystalline slicing by multi-wire saw

    Science.gov (United States)

    Boutouchent-Guerfi, N.; Drouiche, N.; Medjahed, S.; Ould-Hamou, M.; Sahraoui, F.

    2016-08-01

    The environmental and economic impacts linked with solar systems are largely based on discharges of slurry generated during the various stages of sawing and cutting ingots. These discharges into the environment are subject to the general regulations on hazardous and special industrial waste disposal. Therefore, they should not be abandoned or burned in open air. The cutting of Silicon ingots leads to the production of Silicon wafers additional costs, losing more than 30% of Silicon material. Abrasive grains (Silicon Carbide) trapped between the wire and the block of Silicon need to be removed by various mechanisms to be later evacuated by slurry fragments. In the interest of decreasing operational costs during polycrystalline ingot slicing at Semiconductors Research Center, and, avoid environmental problems; it is necessary to recover the solar grade Silicon from the Silicon sawing waste. For this reason, the removal of metal fragments has become a preliminary requirement to regenerate the slurry; in addition, the solid phase needs to be separated from the liquid phase after the dissolution PEG with the solvent. In the present study, magnetic separation and centrifugation methods were adopted for metals removal, followed by the analysis of some operating parameters such as: washing time, pH, and initial concentration of Silicon. Finally, analytical, morphological and basic methods were performed in order to evaluate the efficiency of the process undertaken.

  4. Effect of Grain Boundaries on the Performance of Thin-Film-Based Polycrystalline Silicon Solar Cells: A Numerical Modeling

    Science.gov (United States)

    Chhetri, Nikita; Chatterjee, Somenath

    2018-01-01

    Solar cells/photovoltaic, a renewable energy source, is appraised to be the most effective alternative to the conventional electrical energy generator. A cost-effective alternative of crystalline wafer-based solar cell is thin-film polycrystalline-based solar cell. This paper reports the numerical analysis of dependency of the solar cell parameters (i.e., efficiency, fill factor, open-circuit voltage and short-circuit current density) on grain size for thin-film-based polycrystalline silicon (Si) solar cells. A minority carrier lifetime model is proposed to do a correlation between the grains, grain boundaries and lifetime for thin-film-based polycrystalline Si solar cells in MATLAB environment. As observed, the increment in the grain size diameter results in increase in minority carrier lifetime in polycrystalline Si thin film. A non-equivalent series resistance double-diode model is used to find the dark as well as light (AM1.5) current-voltage (I-V) characteristics for thin-film-based polycrystalline Si solar cells. To optimize the effectiveness of the proposed model, a successive approximation method is used and the corresponding fitting parameters are obtained. The model is validated with the experimentally obtained results reported elsewhere. The experimentally reported solar cell parameters can be found using the proposed model described here.

  5. On the effects of hydrogenation of thin film polycrystalline silicon: A key factor to improve heterojunction solar cells

    Czech Academy of Sciences Publication Activity Database

    Qiu, Y.; Kunz, O.; Fejfar, Antonín; Ledinský, Martin; Teik Chan, B.; Gordon, I.; Van Gestel, D.; Venkatachalm, S.; Egan, R.

    2014-01-01

    Roč. 122, MAR (2014), s. 31-39 ISSN 0927-0248 R&D Projects: GA MŠk 7E10061; GA MŠk(CZ) LM2011026 EU Projects: European Commission(XE) 240826 - PolySiMode Institutional support: RVO:68378271 Keywords : silicon * thin films * polycrystalline * hydrogenation * Raman spectroscopy Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 5.337, year: 2014 http://www.sciencedirect.com/science/article/pii/S0927024813006016

  6. A numerical study of the influence of feeding polycrystalline silicon granules on melt temperature in the continuous Czochralski process

    Science.gov (United States)

    Ono, Naoki; Kida, Michio; Arai, Yoshiaki; Sahira, Kensho

    1993-09-01

    Temperature change was simulated using a solid body rotating melt model when solid polycrystalline silicon granules were supplied to a melt in a double-crucible method. Only heat conduction was considered in the analysis. The influence of the crucible rotation rates and of the initial temperature of the supplied silicon was investigated systematically and quantitatively. The influence of the crucible rotation rate was stronger than expected, which suggests that the crucible rotation rate cannot be lowered too much because of the possibility of the melt solidifying between the inner and outer crucibles.

  7. Protein patterning on polycrystalline silicon-germanium via standard UV lithography for bioMEMS applications

    Energy Technology Data Exchange (ETDEWEB)

    Lenci, S., E-mail: silvia.lenci@gmail.com [Dipartimento di Ingegneria dell' Informazione, University of Pisa, Via G. Caruso 16, I-56122 Pisa (Italy); imec, Kapeldreef 75, Leuven B-3001 (Belgium); Tedeschi, L.; Domenici, C.; Lande, C. [Istituto di Fisiologia Clinica, CNR, via G. Moruzzi 1, Pisa I-56124 (Italy); Nannini, A.; Pennelli, G.; Pieri, F. [Dipartimento di Ingegneria dell' Informazione, University of Pisa, Via G. Caruso 16, I-56122 Pisa (Italy); Severi, S. [imec, Kapeldreef 75, Leuven B-3001 (Belgium)

    2010-10-12

    Polycrystalline silicon-germanium (poly-SiGe) is a promising structural material for the post-processing of micro electro-mechanical systems (MEMS) on top of complementary metal-oxide-semiconductor (CMOS) substrates. Combining MEMS and CMOS allows for the development of high-performance devices. We present for the first time selective protein immobilization on top of poly-SiGe surfaces, an enabling technique for the development of novel poly-SiGe based MEMS biosensors. Active regions made of 3-aminopropyl-triethoxysilane (APTES) were defined using silane deposition onto photoresist patterns followed by lift-off in organic solvents. Subsequently, proteins were covalently bound on the created APTES patterns. Fluorescein-labeled human serum albumin (HSA) was used to verify the immobilization procedure while the binding capability of the protein layer was tested by an antigen-labeled antibody pair. Inspection by fluorescence microscopy showed protein immobilization inside the desired bioactive areas and low non-specific adsorption outside the APTES pattern. Furthermore, the quality of the silane patches was investigated by treatment with 30 nm-diameter gold nanoparticles and scanning electron microscope observation. The developed technique is therefore a promising first step towards the realization of poly-SiGe based biosensors.

  8. Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact

    Energy Technology Data Exchange (ETDEWEB)

    Golt, M. C.; Strawhecker, K. E.; Bratcher, M. S. [U.S. Army Research Laboratory, WMRD, Aberdeen Proving Ground, Maryland 21005 (United States); Shanholtz, E. R. [ORISE, Belcamp, Maryland 21017 (United States)

    2016-07-14

    The unique thermo-electro-mechanical properties of polycrystalline silicon carbide (poly-SiC) make it a desirable candidate for structural and electronic materials for operation in extreme environments. Necessitated by the need to understand how processing additives influence poly-SiC structure and electrical properties, the distribution of lattice defects and impurities across a specimen of hot-pressed 6H poly-SiC processed with p-type additives was visualized with high spatial resolution using a conductive atomic force microscopy approach in which a contact forming a nano-Schottky interface is scanned across the sample. The results reveal very intricate structures within poly-SiC, with each grain having a complex core-rim structure. This complexity results from the influence the additives have on the evolution of the microstructure during processing. It was found that the highest conductivities localized at rims as well as at the interface between the rim and the core. The conductivity of the cores is less than the conductivity of the rims due to a lower concentration of dopant. Analysis of the observed conductivities and current-voltage curves is presented in the context of nano-Schottky contact regimes where the conventional understanding of charge transport to diode operation is no longer valid.

  9. Production of polycrystalline silicon by fluidized-bed-problems and recent progress of study

    Energy Technology Data Exchange (ETDEWEB)

    Kojima, Toshinori

    1988-10-01

    Concerning the production of polycrystalline silicon from SiH/sub 4/ by applying fluidized bed reaction, recent progress of study, problems involved, and countermeasures to them were reported. For the experiment, stainless tube with 50mm inside diameter attached with electric heater on the wall as auxillary heat source was used to measure the temperature distribution in the bed. As the diluting gas, hydrogen and argon were used to investigate the effect of diluent gas and it was understood that sort of diluent gas affected on the crogging and reaction rate. It was indicated that, in the fluidized bed reaction which gave large depositing area and high productivity, contamination was easily occurred. Observation of fine powder by electronic-microscope revealed that different diluent caused the difference of fine powder shape and that the higher the reaction temperature the more fine powder was produced. Crogging condition was affected by tower diameter, together with temperature and fluidizing conditions. In addition, two recent patents were introduced. 11 references, 10 figures.

  10. Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact

    International Nuclear Information System (INIS)

    Golt, M. C.; Strawhecker, K. E.; Bratcher, M. S.; Shanholtz, E. R.

    2016-01-01

    The unique thermo-electro-mechanical properties of polycrystalline silicon carbide (poly-SiC) make it a desirable candidate for structural and electronic materials for operation in extreme environments. Necessitated by the need to understand how processing additives influence poly-SiC structure and electrical properties, the distribution of lattice defects and impurities across a specimen of hot-pressed 6H poly-SiC processed with p-type additives was visualized with high spatial resolution using a conductive atomic force microscopy approach in which a contact forming a nano-Schottky interface is scanned across the sample. The results reveal very intricate structures within poly-SiC, with each grain having a complex core-rim structure. This complexity results from the influence the additives have on the evolution of the microstructure during processing. It was found that the highest conductivities localized at rims as well as at the interface between the rim and the core. The conductivity of the cores is less than the conductivity of the rims due to a lower concentration of dopant. Analysis of the observed conductivities and current-voltage curves is presented in the context of nano-Schottky contact regimes where the conventional understanding of charge transport to diode operation is no longer valid.

  11. Recrystallization behaviour and electrical properties of germanium ion implanted polycrystalline silicon films

    International Nuclear Information System (INIS)

    Kang, Myeon-Koo; Matsui, Takayuki; Kuwano, Hiroshi

    1996-01-01

    The recrystallization behaviour of undoped and phosphorus-doped polycrystalline silicon films amorphized by germanium ion implantation at doses ranging from 1 x 10 15 to 1 x 10 16 cm -2 are investigated, and the electrical properties of phosphorus-doped films after recrystallization are studied. The phosphorus doping concentration ranges from 3 x 10 18 to 1 x 10 20 cm -3 . It is found that the nucleation rate decreases for undoped films and increases for phosphorus-doped films with increasing germanium dose; the growth rates decrease for both doped and undoped films. The decrease in nucleation rate is caused by the increase in implantation damage. The decrease in growth rate is considered to be due to the increase in lattice strain. The grain size increases with germanium dose for undoped films, but decreases for phosphorus-doped films. The dependence of the electrical properties of the recrystallized films as a function of phosphorus doping concentration with different germanium doses can be explained in terms of the grain size, crystallinity and grain boundary barrier height. (Author)

  12. Thermal oxidation effect on structural and optical properties of heavily doped phosphorus polycrystalline silicon films

    Energy Technology Data Exchange (ETDEWEB)

    Birouk, B.; Madi, D. [Universite de Jijel, Laboratoire d' Etudes et de Modelisation en Electrotechnique (LAMEL), Cite Ouled Aissa, BP 98, Jijel (Algeria)

    2011-08-15

    The study reported in this paper contributes to better understanding the thermal oxidation effect on structural and optical properties of polycrystalline silicon heavily in situ P-LPCVD films. The deposits, doped at levels 3 x 10{sup 19} and 1.6 x 10{sup 20} cm{sup -3}, have been elaborated from silane decomposition (400 mTorrs, 605 C) on monosilicon substrate oriented left angle 111 right angle. The thermal oxidation was performed at temperatures: 850 C during 1 hour, 1000, 1050, and 1100 C during 15 minutes. The XRD spectra analysis pointed out significant left angle 111 right angle texture evolution, while in the case of left angle 220 right angle and left angle 311 right angle textures, the intensities are practically invariant (variations fall in the uncertainty intervals). The optical characterizations showed that refractive index and absorption coefficient are very sensitive to the oxidation treatment, mainly when the doping level is not very high. We think that atomic oxygen acts as defects passivating agent leading to carriers' concentration increasing. Besides, the optical behavior is modeled in visible and near infrared, by a seven-term polynomial function n {sup 2}=f({lambda} {sup 2}), with alternate signs, instead of theoretically unlimited terms number from Drude's model. It has been shown that fitting parameters fall on Gaussian curves like they do in the theoretical model. (orig.)

  13. Performance of in-pixel circuits for photon counting arrays (PCAs) based on polycrystalline silicon TFTs

    International Nuclear Information System (INIS)

    Liang, Albert K; Koniczek, Martin; Antonuk, Larry E; El-Mohri, Youcef; Zhao, Qihua; Street, Robert A; Lu, Jeng Ping

    2016-01-01

    Photon counting arrays (PCAs), defined as pixelated imagers which measure the absorbed energy of x-ray photons individually and record this information digitally, are of increasing clinical interest. A number of PCA prototypes with a 1 mm pixel-to-pixel pitch have recently been fabricated with polycrystalline silicon (poly-Si)—a thin-film technology capable of creating monolithic imagers of a size commensurate with human anatomy. In this study, analog and digital simulation frameworks were developed to provide insight into the influence of individual poly-Si transistors on pixel circuit performance—information that is not readily available through empirical means. The simulation frameworks were used to characterize the circuit designs employed in the prototypes. The analog framework, which determines the noise produced by individual transistors, was used to estimate energy resolution, as well as to identify which transistors contribute the most noise. The digital framework, which analyzes how well circuits function in the presence of significant variations in transistor properties, was used to estimate how fast a circuit can produce an output (referred to as output count rate). In addition, an algorithm was developed and used to estimate the minimum pixel pitch that could be achieved for the pixel circuits of the current prototypes. The simulation frameworks predict that the analog component of the PCA prototypes could have energy resolution as low as 8.9% full width at half maximum (FWHM) at 70 keV; and the digital components should work well even in the presence of significant thin-film transistor (TFT) variations, with the fastest component having output count rates as high as 3 MHz. Finally, based on conceivable improvements in the underlying fabrication process, the algorithm predicts that the 1 mm pitch of the current PCA prototypes could be reduced significantly, potentially to between ∼240 and 290 μm. (paper)

  14. Continuous Czochralski growth. Development of advanced Czochralski growth process to produce low cost 150 kg silicon ingots from a single crucible for technology readiness

    Science.gov (United States)

    The improvement of growth rates using radiation shielding and investigation of the crucible melt interaction for improved yields were emphasized. Growth runs were performed from both 15 and 16 inch diameter crucibles, producing 30 and 37 kg ingots respectively. Efforts to increase the growth rate of 150 mm diameter ingots were limited by temperature instabilities believed to be caused by undesirable thermal convections in the larger melts. The radiation shield improved the growth rate somewhat, but the thermal instability was still evident, leading to nonround ingots and loss of dislocation-free structure. A 38 kg crystal was grown to demonstrate the feasibility of producing 150 kg with four growth cycles. After the grower construction phase, the Hamco microprocessor control system was interfaced to the growth facility, including the sensor for automatic control of seeding temperature, and the sensor for automatic shouldering. Efforts focused upon optimization of the seeding, necking, and shoulder growth automation programs.

  15. Studies on the polycrystalline silicon/SiO2 stack as front surface field for IBC solar cells by two-dimensional simulations

    International Nuclear Information System (INIS)

    Jiang Shuai; Jia Rui; Tao Ke; Hou Caixia; Sun Hengchao; Li Yongtao; Yu Zhiyong

    2017-01-01

    Interdigitated back contact (IBC) solar cells can achieve a very high efficiency due to its less optical losses. But IBC solar cells demand for high quality passivation of the front surface. In this paper, a polycrystalline silicon/SiO 2 stack structure as front surface field to passivate the front surface of IBC solar cells is proposed. The passivation quality of this structure is investigated by two dimensional simulations. Polycrystalline silicon layer and SiO 2 layer are optimized to get the best passivation quality of the IBC solar cell. Simulation results indicate that the doping level of polycrystalline silicon should be high enough to allow a very thin polycrystalline silicon layer to ensure an effective passivation and small optical losses at the same time. The thickness of SiO 2 should be neither too thin nor too thick, and the optimal thickness is 1.2 nm. Furthermore, the lateral transport properties of electrons are investigated, and the simulation results indicate that a high doping level and conductivity of polycrystalline silicon can improve the lateral transportation of electrons and then the cell performance. (paper)

  16. Initial steps toward the realization of large area arrays of single photon counting pixels based on polycrystalline silicon TFTs

    Science.gov (United States)

    Liang, Albert K.; Koniczek, Martin; Antonuk, Larry E.; El-Mohri, Youcef; Zhao, Qihua; Jiang, Hao; Street, Robert A.; Lu, Jeng Ping

    2014-03-01

    The thin-film semiconductor processing methods that enabled creation of inexpensive liquid crystal displays based on amorphous silicon transistors for cell phones and televisions, as well as desktop, laptop and mobile computers, also facilitated the development of devices that have become ubiquitous in medical x-ray imaging environments. These devices, called active matrix flat-panel imagers (AMFPIs), measure the integrated signal generated by incident X rays and offer detection areas as large as ~43×43 cm2. In recent years, there has been growing interest in medical x-ray imagers that record information from X ray photons on an individual basis. However, such photon counting devices have generally been based on crystalline silicon, a material not inherently suited to the cost-effective manufacture of monolithic devices of a size comparable to that of AMFPIs. Motivated by these considerations, we have developed an initial set of small area prototype arrays using thin-film processing methods and polycrystalline silicon transistors. These prototypes were developed in the spirit of exploring the possibility of creating large area arrays offering single photon counting capabilities and, to our knowledge, are the first photon counting arrays fabricated using thin film techniques. In this paper, the architecture of the prototype pixels is presented and considerations that influenced the design of the pixel circuits, including amplifier noise, TFT performance variations, and minimum feature size, are discussed.

  17. Report on achievements in fiscal 1999. Research and development of immediately effective and innovative energy environment technology (Development of immediately effective and high-efficiency solar cell technology, development of high-quality ingot manufacturing technology, and development of high-efficiency cell making technology); 1999 nendo sokkoteki kakushinteki energy kankyo gijutsu kenkyu kaihatsu seika hokokusho. Sokkogata kokoritsu taiyo denchi gijutsu kaihatsu (kohinshitsu ingot seizo gijutsu kaihatsu / kohinshitsu cell ka gijutsu kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2000-03-01

    Research and development has been made on improving quality of ingots for substrates, manufacturing high-quality thin type substrates, and making high-efficiency cells. This paper summarizes the achievements in fiscal 1999. In developing the high-quality ingot manufacturing technology, discussions were given on a method for assessing impurities and crystal defects by using the total reflection scattering type infrared tomography, and on the optimal solidifying and cooling conditions during the ingot manufacturing by using simulation calculation for solidification. As a result of analyses and discussions, such findings were found effective that the ingot should be solidified through making the solid-liquid interface shape flat, and the temperature falling rate in an ingot should be maintained constant. In developing the high-efficiency cell making technology, discussions were given on the optimal construction based on a simulation that assumes the light sealing structure using the RIE method, and on the optimal construction of polycrystalline silicon solar cells by using a device simulator (PCID). The important factors in achieving a conversion efficiency of 20% are the light sealing structure, surface passivation, and substrate thickness. (NEDO)

  18. Flash-lamp-crystallized polycrystalline silicon films with high hydrogen concentration formed from Cat-CVD a-Si films

    International Nuclear Information System (INIS)

    Ohdaira, Keisuke; Tomura, Naohito; Ishii, Shohei; Matsumura, Hideki

    2011-01-01

    We investigate residual forms of hydrogen (H) atoms such as bonding configuration in poly-crystalline silicon (poly-Si) films formed by the flash-lamp-induced crystallization of catalytic chemical vapor deposited (Cat-CVD) a-Si films. Raman spectroscopy reveals that at least part of H atoms in flash-lamp-crystallized (FLC) poly-Si films form Si-H 2 bonds as well as Si-H bonds with Si atoms even using Si-H-rich Cat-CVD a-Si films, which indicates the rearrangement of H atoms during crystallization. The peak desorption temperature during thermal desorption spectroscopy (TDS) is as high as 900 o C, similar to the reported value for bulk poly-Si.

  19. Low-energy ion bombardment to tailor the interfacial and mechanical properties of polycrystalline 3C-silicon carbide

    International Nuclear Information System (INIS)

    Liu Fang; Li, Carolina H.; Pisano, Albert P.; Carraro, Carlo; Maboudian, Roya

    2010-01-01

    Low-energy Ar + ion bombardment of polycrystalline 3C-silicon carbide (poly-SiC) films is found to be a promising surface modification method to tailor the mechanical and interfacial properties of poly-SiC. The film average stress decreases as the ion energy and the bombardment time increase. Furthermore, this treatment is found to change the strain gradient of the films from positive to negative values. The observed changes in stress and strain gradient are explained by ion peening and thermal spikes models. In addition, the poly-SiC films show a significant enhancement in corrosion resistance by this treatment, which is attributed to a reduction in surface energy and to an increase in the compressive stress in the near-surface region.

  20. Non-classical polycrystalline silicon thin-film transistor with embedded block-oxide for suppressing the short channel effect

    International Nuclear Information System (INIS)

    Lin, Jyi-Tsong; Huang, Kuo-Dong; Hu, Shu-Fen

    2008-01-01

    In this paper, a polycrystalline silicon (polysilicon) thin-film transistor with a block oxide enclosing body, BTFT, is fabricated and investigated. By utilizing the block-oxide structure of thin-film transistors, the BTFT is shown to suppress the short channel effect. This proposed structure is formed by burying self-aligned oxide spacers along the sidewalls of the source and drain junctions, which reduces the P–N junction area, thereby reducing the junction capacitance and leakage current. Measurements demonstrate that the BTFT eliminates the punch-through effect even down to gate lengths of 1.5 µm, whereas the conventional TFT suffers serious short channel effects at this gate length

  1. THE RETENTION OF KRYPTON IN POLYCRYSTALLINE SILICON DURING HIGH-TEMPERATURE ANNEALING

    NARCIS (Netherlands)

    GREUTER, MJW; NIESEN, L; VANVEEN, A; EVANS, JH

    1994-01-01

    In a study into the annealing behaviour of silicon containing a few atomic per cent of krypton, it was found that, even at 0.87 of the silicon melting temperature, approximately 90% of the original krypton was still present. This result is compared with analogous work on metals where copious inert

  2. TU-FG-209-03: Exploring the Maximum Count Rate Capabilities of Photon Counting Arrays Based On Polycrystalline Silicon

    Energy Technology Data Exchange (ETDEWEB)

    Liang, A K; Koniczek, M; Antonuk, L E; El-Mohri, Y; Zhao, Q [University of Michigan, Ann Arbor, MI (United States)

    2016-06-15

    Purpose: Photon counting arrays (PCAs) offer several advantages over conventional, fluence-integrating x-ray imagers, such as improved contrast by means of energy windowing. For that reason, we are exploring the feasibility and performance of PCA pixel circuitry based on polycrystalline silicon. This material, unlike the crystalline silicon commonly used in photon counting detectors, lends itself toward the economic manufacture of radiation tolerant, monolithic large area (e.g., ∼43×43 cm2) devices. In this presentation, exploration of maximum count rate, a critical performance parameter for such devices, is reported. Methods: Count rate performance for a variety of pixel circuit designs was explored through detailed circuit simulations over a wide range of parameters (including pixel pitch and operating conditions) with the additional goal of preserving good energy resolution. The count rate simulations assume input events corresponding to a 72 kVp x-ray spectrum with 20 mm Al filtration interacting with a CZT detector at various input flux rates. Output count rates are determined at various photon energy threshold levels, and the percentage of counts lost (e.g., due to deadtime or pile-up) is calculated from the ratio of output to input counts. The energy resolution simulations involve thermal and flicker noise originating from each circuit element in a design. Results: Circuit designs compatible with pixel pitches ranging from 250 to 1000 µm that allow count rates over a megacount per second per pixel appear feasible. Such rates are expected to be suitable for radiographic and fluoroscopic imaging. Results for the analog front-end circuitry of the pixels show that acceptable energy resolution can also be achieved. Conclusion: PCAs created using polycrystalline silicon have the potential to offer monolithic large-area detectors with count rate performance comparable to those of crystalline silicon detectors. Further improvement through detailed circuit

  3. Remelt Ingot Production Technology

    Science.gov (United States)

    Grandfield, J. F.

    The technology related to the production of remelt ingots (small ingots, sows and T-Bar) is reviewed. Open mold conveyors, sow casting, wheel and belt casting and VDC and HDC casting are described and compared. Process economics, capacity, product quality and process problems are listed. Trends in casting machine technology such as longer open mold conveyor lines are highlighted. Safety issues related to the operation of these processes are discussed. The advantages and disadvantages of the various machine configurations and options e.g. such as dry filling with the mold out of water and wet filling with the mold in water for open mould conveyors are discussed. The effect of mold design on machine productivity, mold cracking and mold life is also examined.

  4. Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

    Directory of Open Access Journals (Sweden)

    Hidetoshi Nakanishi

    2015-11-01

    Full Text Available A laser terahertz emission microscope (LTEM can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g., electroluminescence (EL, photoluminescence (PL, and laser beam induced current (LBIC, as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL, and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell.

  5. Anisotropic etching of polycrystalline silicon with a hot Cl2 molecular beam

    International Nuclear Information System (INIS)

    Suzuki, K.; Hiraoka, S.; Nishimatsu, S.

    1988-01-01

    A hot Cl 2 molecular (Cl/sup */ 2 ) beam was successfully applied to achieve highly anisotropic, highly selective, and almost damage-free etching of polycrystalline Si. The anisotropy, the ratio of etch rates in vertical and horizontal directions, was larger than 25. The selectivity, the ratio of polycrystalline Si and SiO 2 etch rates, was larger than 1000. The Cl/sup */ 2 beam was produced by free jet expansion of a Cl 2 gas heated in a graphite furnace. The furnace temperature was 830 0 C. The substrate temperature was 180 0 C. The average total energy (0.38 eV) of a Cl/sup */ 2 molecule impinging on a substrate surface is much lower than the critical energy (approximately 10 eV) to displace the atoms of the etched material and to cause surface damage. This is the essential reason why this highly selective and almost damage-free etching has been achieved. The highly anisotropic etching mechanism is explained by a model taking into account the directional incidence of Cl/sup */ 2 molecules to the surface, and the deactivation process of the Cl/sup */ 2 molecules on a cold surface

  6. Formation of a Polycrystalline Silicon Thin Film by Using Blue Laser Diode Annealing

    Science.gov (United States)

    Choi, Young-Hwan; Ryu, Han-Youl

    2018-04-01

    We report the crystallization of an amorphous silicon thin film deposited on a SiO2/Si wafer using an annealing process with a high-power blue laser diode (LD). The laser annealing process was performed using a continuous-wave blue LD of 450 nm in wavelength with varying laser output power in a nitrogen atmosphere. The crystallinity of the annealed poly-silicon films was investigated using ellipsometry, electron microscope observation, X-ray diffraction, and Raman spectroscopy. Polysilicon grains with > 100-nm diameter were observed to be formed after the blue LD annealing. The crystal quality was found to be improved as the laser power was increased up to 4 W. The demonstrated blue LD annealing is expected to provide a low-cost and versatile solution for lowtemperature poly-silicon processes.

  7. Influence of Temperature on the Performance of Photovoltaic Polycrystalline Silicon Module in the Bruneian Climate

    Directory of Open Access Journals (Sweden)

    A. Q. Malik

    2017-11-01

    Full Text Available The influence of working temperature for  a  polysilicon module has been investigated in Brunei Darussalam for a period of two years.  The rise in temperature produces thermal agitation which not only increases the dark current but also enhances the losses of free carriers in a polycrystalline module. The efficiency and the output power decreases with an increase in the working temperature. A maximum decline in the output power of 97% has been measured under a dominated diffused radiation environment. The temperature coefficients have been obtained and equations are developed to evaluate the change in the rating of module at any working temperature with reference to their values at STC.

  8. Synthesis and characterization of silicon-doped polycrystalline GaN ...

    Indian Academy of Sciences (India)

    Administrator

    300 to 623 K on fused silica and silicon substrates by radio frequency (r.f.) magnetron sputtering at a system pressure of ~ 5 ..... Yu H B, Chen H, Li D, Han Y J, Zheng X H, Huang Q and ... Hong J-II, Chang Y, Ding Y, Wang Z L and Snyder R L.

  9. N-type polycrystalline silicon films formed on alumina by aluminium induced crystallization and overdoping

    Energy Technology Data Exchange (ETDEWEB)

    Tuezuen, O. [InESS, UMR 7163 CNRS-ULP, 23 rue du Loess, F-67037 Strasbourg (France)], E-mail: Ozge.Tuzun@iness.c-strasbourg.fr; Slaoui, A. [InESS, UMR 7163 CNRS-ULP, 23 rue du Loess, F-67037 Strasbourg (France); Gordon, I. [IMEC, Kapeldreef 75, B-3001 Leuven (Belgium); Focsa, A. [InESS, UMR 7163 CNRS-ULP, 23 rue du Loess, F-67037 Strasbourg (France); Ballutaud, D. [GEMaC-UMR 8635 CNRS, 1 place Aristide Briand, F-92195 Meudon (France); Beaucarne, G.; Poortmans, J. [IMEC, Kapeldreef 75, B-3001 Leuven (Belgium)

    2008-08-30

    In this work, we investigated the formation of n-type polysilicon films on alumina substrates by overdoping a p-type silicon layer obtained by aluminium induced crystallization of amorphous silicon (AIC), and subsequent epitaxy. The phosphorus doping of the AIC was carried out by thermal diffusion from a solid source. The structural quality of the n-type Si film was monitored by optical microscope and scanning electron microscope (SEM). The doping efficiency was determined by resistivity measurements and secondary ion mass spectroscopy (SIMS). The sheet resitivity changed from 2700{omega}/sq to 19.6{omega}/sq after thermal diffusion at 950 deg. C for 1h, indicating the overdoping effect. The SIMS profile carried out after the high temperature epitaxy exhibits a two steps phosphorus distribution, indicating the formation of an n{sup +}n structure.

  10. Tribological performance of polycrystalline tantalum-carbide-incorporated diamond films on silicon substrates

    Science.gov (United States)

    Ullah, Mahtab; Rana, Anwar Manzoor; Ahmed, E.; Malik, Abdul Sattar; Shah, Z. A.; Ahmad, Naseeb; Mehtab, Ujala; Raza, Rizwan

    2018-05-01

    Polycrystalline tantalum-carbide-incorporated diamond coatings have been made on unpolished side of Si (100) wafer by hot filament chemical vapor deposition process. Morphology of the coatings has been found to vary from (111) triangular-facetted to predominantly (111) square-faceted by increasing the concentration of tantalum carbide. The results have been compared to those of a diamond reference coating with no tantalum content. An increase in roughness has been observed with the increase of tantalum carbide (TaC) due to change in morphology of the diamond films. It is noticed that roughness of the coatings increases as grains become more square-faceted. It is found that diamond coatings involving tantalum carbide are not as resistant as diamond films with no TaC content and the coefficient of friction for such coatings with microcrystalline grains can be manipulated to 0·33 under high vacuum of 10-7 Torr. Such a low friction coefficient value enhances tribological behavior of unpolished Si substrates and can possibly be used in sliding applications.

  11. Development of a Self Aligned CMOS Process for Flash Lamp Annealed Polycrystalline Silicon TFTs

    Science.gov (United States)

    Bischoff, Paul

    The emerging active matrix liquid crystal (AMLCD) display market requires a high performing semiconductor material to meet rising standards of operation. Currently amorphous silicon (a-Si) dominates the market but it does not have the required mobility for it to be used in AMLCD manufacturing. Other materials have been developed including crystallizing a-Si into poly-silicon. A new approach to crystallization through the use of flash lamp annealing (FLA) decreases manufacturing time and greatly improves carrier mobility. Previous work on FLA silicon for the use in CMOS transistors revealed significant lateral dopant diffusion into the channel greatly increasing the minimum channel length required for a working device. This was further confounded by the gate overlap due to misalignment during lithography patterning steps. Through the use of furnace dopant activation instead of FLA dopant activation and a self aligned gate the minimum size transistor can be greatly reduced. A new lithography mask and process flow were developed for the furnace annealing and self aligned gate. Fabrication of the self aligned devices resulted in oxidation of the Molybdenum self aligned gate. Further development is needed to successfully manufacture these devices. Non-self aligned transistors were made simultaneously with self aligned devices and used the furnace activation. These devices showed an increase in sheet resistance from 250 O to 800 O and lower mobility from 380 to 40.2 V/cm2s. The lower mobility can be contributed to an increase in implanted trap density indicating furnace annealing is an inferior activation method over FLA. The minimum transistor size however was reduced from 20 to 5 mum. With improvements in the self aligned process high performing small devices can be manufactured.

  12. Rapid Thermal Annealing and Hydrogen Passivation of Polycrystalline Silicon Thin-Film Solar Cells on Low-Temperature Glass

    Directory of Open Access Journals (Sweden)

    Mason L. Terry

    2007-01-01

    Full Text Available The changes in open-circuit voltage (Voc, short-circuit current density (Jsc, and internal quantum efficiency (IQE of aLuminum induced crystallization, ion-assisted deposition (ALICIA polycrystalline silicon thin-film solar cells on low-temperature glass substrates due to rapid thermal anneal (RTA treatment and subsequent remote microwave hydrogen plasma passivation (hydrogenation are examined. Voc improvements from 130 mV to 430 mV, Jsc improvements from 1.2 mA/cm2 to 11.3 mA/cm2, and peak IQE improvements from 16% to > 70% are achieved. A 1-second RTA plateau at 1000°C followed by hydrogenation increases the Jsc by a factor of 5.5. Secondary ion mass spectroscopy measurements are used to determine the concentration profiles of dopants, impurities, and hydrogen. Computer modeling based on simulations of the measured IQE data reveals that the minority carrier lifetime in the absorber region increases by 3 orders of magnitude to about 1 nanosecond (corresponding to a diffusion length of at least 1 μm due to RTA and subsequent hydrogenation. The evaluation of the changes in the quantum efficiency and Voc due to RTA and hydrogenation with computer modeling significantly improves the understanding of the limiting factors to cell performance.

  13. Fabrication of polycrystalline silicon thin films on glass substrates using fiber laser crystallization

    Energy Technology Data Exchange (ETDEWEB)

    Dao, Vinh Ai; Han, Kuymin; Heo, Jongkyu; Kyeong, Dohyeon; Kim, Jaehong; Lee, Youngseok; Kim, Yongkuk; Jung, Sungwook; Kim, Kyunghae [Information and Communication Device Laboratory, School of Information and Communication Engineering, Sungkyunkwan University (Korea, Republic of); Yi, Junsin, E-mail: yi@yurim.skku.ac.k [Information and Communication Device Laboratory, School of Information and Communication Engineering, Sungkyunkwan University (Korea, Republic of)

    2009-05-29

    Laser crystallization of amorphous silicon (a-Si), using a fiber laser of {lambda} = 1064 nm wavelength, was investigated. a-Si films with 50 nm thickness deposited on glass were prepared by a plasma enhanced chemical vapor deposition. The infrared fundamental wave ({lambda} = 1064 nm) is not absorbed by amorphous silicon (a-Si) films. Thus, different types of capping layers (a-CeO{sub x}, a-SiN{sub x}, and a-SiO{sub x}) with a desired refractive index, n and thickness, d were deposited on the a-Si surface. Crystallization was a function of laser energy density, and was performed using a fiber laser. The structural properties of the crystallized films were measured via Raman spectra, a scanning electron microscope (SEM), and an atomic force microscope (AFM). The relationship between film transmittance and crystallinity was discussed. As the laser energy density increased from 10-40 W, crystallinity increased from 0-90%. However, the higher laser density adversely affected surface roughness and uniformity of the grain size. We found that favorable crystallization and uniformity could be accomplished at the lower energy density of 30 W with a-SiO{sub x} as the capping layer.

  14. Investigating PID Shunting in Polycrystalline Silicon Modules via Multiscale, Multitechnique Characterization

    Energy Technology Data Exchange (ETDEWEB)

    Harvey, Steven P [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Moseley, John [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Norman, Andrew [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Hacke, Peter L [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Johnston, Steven [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Al-Jassim, Mowafak M [National Renewable Energy Laboratory (NREL), Golden, CO (United States); Stokes, Adam [Colorado School of Mines; Gorman, Brian [Colorado School of Mines

    2018-02-27

    We investigated the potential-induced degradation (PID) shunting mechanism in multicrystalline-silicon photovoltaic modules by using a multiscale, multitechnique characterization approach. Both field-stressed modules and laboratory-stressed mini modules were studied. We used photoluminescence, electroluminescence, and dark lock-in thermography imaging to identify degraded areas at the module scale. Small samples were then removed from degraded areas, laser marked, and imaged by scanning electron microscopy. We used simultaneous electron-beam induced current imaging and focused ion beam milling to mark around PID shunts for chemical analysis by time-of-flight secondary-ion mass spectrometry or to isolate individual shunt defects for transmission electron microscopy and atom-probe tomography analysis. By spanning a range of 10 orders of magnitude in size, this approach enabled us to investigate the root-cause mechanisms for PID shunting. We observed a direct correlation between recombination active shunts and sodium content. The sodium content in shunted areas peaks at the SiNX/Si interface and is consistently observed at a concentration of 0.1% to 2% in shunted areas. Analysis of samples subjected to PID recovery, either activated by electron beam or thermal effects only, reveals that recovery of isolated shunts correlates with diffusion of sodium out of the structural defects to the silicon surface. We observed the role of oxygen and chlorine in PID shunting and found that those species - although sometimes present in structural defects where PID shunting was observed - do not play a consistent role in PID shunting.

  15. Polycrystalline ZnO: B grown by LPCVD as TCO for thin film silicon solar cells

    International Nuclear Information System (INIS)

    Fay, Sylvie; Steinhauser, Jerome; Nicolay, Sylvain; Ballif, Christophe

    2010-01-01

    Conductive zinc oxide (ZnO) grown by low pressure chemical vapor deposition (LPCVD) technique possesses a rough surface that induces an efficient light scattering in thin film silicon (TF Si) solar cells, which makes this TCO an ideal candidate for contacting such devices. IMT-EPFL has developed an in-house LPCVD process for the deposition of nanotextured boron doped ZnO films used as rough TCO for TF Si solar cells. This paper is a general review and synthesis of the study of the electrical, optical and structural properties of the ZnO:B that has been performed at IMT-EPFL. The influence of the free carrier absorption and the grain size on the electrical and optical properties of LPCVD ZnO:B is discussed. Transport mechanisms at grain boundaries are studied. It is seen that high doping of the ZnO grains facilitates the tunnelling of the electrons through potential barriers that are located at the grain boundaries. Therefore, even if these potential barriers increase after an exposition of the film to a humid atmosphere, the heavily doped LPCVD ZnO:B layers show a remarkable stable conductivity. However, the introduction of diborane in the CVD reaction induces also a degradation of the intra-grain mobility and increases over-proportionally the optical absorption of the ZnO:B films. Hence, the necessity to finely tune the doping level of LPCVD ZnO:B films is highlighted. Finally, the next challenges to push further the optimization of LPCVD ZnO:B films for thin film silicon solar cells are discussed, as well as some remarkable record cell results achieved with LPCVD ZnO:B as front electrode.

  16. Influence of the transition region between p- and n-type polycrystalline silicon passivating contacts on the performance of interdigitated back contact silicon solar cells

    Science.gov (United States)

    Reichel, Christian; Müller, Ralph; Feldmann, Frank; Richter, Armin; Hermle, Martin; Glunz, Stefan W.

    2017-11-01

    Passivating contacts based on thin tunneling oxides (SiOx) and n- and p-type semi-crystalline or polycrystalline silicon (poly-Si) enable high passivation quality and low contact resistivity, but the integration of these p+/n emitter and n+/n back surface field junctions into interdigitated back contact silicon solar cells poses a challenge due to high recombination at the transition region from p-type to n-type poly-Si. Here, the transition region was created in different configurations—(a) p+ and n+ poly-Si regions are in direct contact with each other ("pn-junction"), using a local overcompensation (counterdoping) as a self-aligning process, (b) undoped (intrinsic) poly-Si remains between the p+ and n+ poly-Si regions ("pin-junction"), and (c) etched trenches separate the p+ and n+ poly-Si regions ("trench")—in order to investigate the recombination characteristics and the reverse breakdown behavior of these solar cells. Illumination- and injection-dependent quasi-steady state photoluminescence (suns-PL) and open-circuit voltage (suns-Voc) measurements revealed that non-ideal recombination in the space charge regions with high local ideality factors as well as recombination in shunted regions strongly limited the performance of solar cells without a trench. In contrast, solar cells with a trench allowed for open-circuit voltage (Voc) of 720 mV, fill factor of 79.6%, short-circuit current (Jsc) of 41.3 mA/cm2, and a conversion efficiencies (η) of 23.7%, showing that a lowly conducting and highly passivating intermediate layer between the p+ and n+ poly-Si regions is mandatory. Independent of the configuration, no hysteresis was observed upon multiple stresses in reverse direction, indicating a controlled and homogeneously distributed breakdown, but with different breakdown characteristics.

  17. Polycrystalline silicon film solar cells on insulator devices. Final report; Duennschichtsolarzellen aus kristallinem Silicium auf Glassubstraten. Abschlussbericht

    Energy Technology Data Exchange (ETDEWEB)

    Werner, J.H.; Wagner, T.A.; Bruehne, K.; Berge, C.; Dassow, R.; Jensen, N.; Koehler, J.; Nerding, M.; Oberbeck, L.; Rinke, T.J.; Bergmann, R.B.; Schubert, M.B.

    2002-07-01

    The goal of presenting a highly efficient thin film silicon solar cell was achieved by manufacturing a 4 cm{sup 2}, 45 {mu}m thin cell with an AM1.5 efficiency of 16.6% (confirmed by FhG-ISE, Freiburg, Germany). This result reflects the potential of a novel transfer technique for single-crystalline silicon thin films which uses an electrochemically etched separation layer. Since the year 2000, this method was investigated in this project, and it proved to be very promising for manufacturing high efficiency thin film silicon solar cells. The transfer technique is now subject of a project in continuation in order to verify the feasibility of its industrial application. Polycrystalline silicon with grain sizes in the range of (1-100) {mu}m suffers from grain boundaries crossing the pn-junction which enhance recombination, and thereby limit the output voltage of respective solar cells to very low, and practically useless values. For the first time, a complete analysis of these limitations is given. Hence, the initial approach of epitaxially growing solar cell absorbers on a laser-crystallised seed layer proved not successful. After proper optimisation, hot-wire chemical vapour deposition (HW-CVD) yields <110>-textured nanocrystalline silicon (nc-Si) films with stable and improved electronic properties. A successful use in stacked 'micromorph' solar cells, however, seems unlikely since the deposition rate of high-quality nc-Si from HW-CVD turns out to be as low as such as plasma deposited nc-Si. As further project results, there are spin-offs for microelectronics from ion-assisted deposition (IAD), for displays from laser crystallisation, and for photovoltaics in heterojunction solar cells. (orig.) [German] Das Projektziel wurde mit der Herstellung einer 45 {mu}m duennen, monokristallinen Siliciumsolarzelle auf Glas mit einem Wandlungswirkungsgrad von 16,6% (bestaetigt bei FhG-ISE, Freiburg) erreicht. Dieses Ergebnis war moeglich durch die Anwendung einer neu

  18. Segregation and Clustering Effects on Complex Boron Redistribution in Strongly Doped Polycrystalline-Silicon Layers

    International Nuclear Information System (INIS)

    Abadli, S.; Mansour, F.

    2011-01-01

    This work deals with the investigation of the complex phenomenon of boron (B) transient enhanced diffusion (TED) in strongly implanted silicon (Si) layers. It concerns the instantaneous influences of the strong B concentrations, the Si layers crystallization, the clustering and the B trapping/segregation during thermal post-implantation annealing. We have used Si thin layers obtained from disilane (Si2H6) by low pressure chemical vapor deposition (LPCVD) and then B implanted with a dose of 4 x 1015 atoms/cm2 at an energy of 15 keV. To avoid long redistributions, thermal annealing was carried out at relatively low-temperatures (700, 750 and 800 'deg'C) for various short-times ranging between 1 and 30 minutes. To investigate the experimental secondary ion mass spectroscopy (SIMS) doping profiles, a redistribution model well adapted to the particular structure of Si-LPCVD layers and to the effects of strong-concentrations has been established. The good adjustment of the simulated profiles with the experimental SIMS profiles allowed a fundamental understanding about the instantaneous physical phenomena giving and disturbing the TED process in strongly doped Si-LPCVD layers. It was found that boron TED is strongly affected by the simultaneous complex kinetics of clustering, crystallization, trapping and segregation during annealing. The fast formation of small Si-B clusters enhances the B diffusivity whereas the evolution of the clusters and segregation reduce this enhancement. (author)

  19. Fabrication and characterization of novel gate-all-around polycrystalline silicon junctionless field-effect transistors with ultrathin horizontal tube-shape channel

    Science.gov (United States)

    Chang, You-Tai; Peng, Kang-Ping; Li, Pei-Wen; Lin, Horng-Chih

    2018-04-01

    In this paper, we report on a novel fabrication process for the production of junctionless field-effect transistors with an ultrathin polycrystalline silicon (poly-Si) tube channel in a gate-all-around (GAA) configuration. The core of the poly-Si tube channel is filled with either a silicon nitride or a silicon oxide layer, and the effects of the core layers on the device characteristics are evaluated. The devices show excellent switching performance, thanks to the combination of the ultrathin tube channel and the GAA structure. Hysteresis loops in the transfer characteristics of the nitride-core devices are observed, owing to the dynamic trapping of electrons in the nitride core.

  20. Effective hydrogenation and surface damage induced by MW-ECR plasma of fine-grained polycrystalline silicon

    Energy Technology Data Exchange (ETDEWEB)

    Madi, D. [Institut d' Electronique du Solide et des Systemes (InESS)-CNRS/UdS, Strasbourg (France); Universite de Jijel, Laboratoire d' Etudes et de Modelisation en Electrotechnique (LAMEL), Faculte des Sciences de l' Ingenieur, Jijel (Algeria); Prathap, P.; Focsa, A.; Slaoui, A. [Institut d' Electronique du Solide et des Systemes (InESS)-CNRS/UdS, Strasbourg (France); Birouk, B. [Universite de Jijel, Laboratoire d' Etudes et de Modelisation en Electrotechnique (LAMEL), Faculte des Sciences de l' Ingenieur, Jijel (Algeria)

    2010-06-15

    This work reports the investigations on the effects of the hydrogenation process of thin film polycrystalline n{sup +}pp{sup +} mesa silicon cells using MW-ECR plasma in a conventional PECVD system. Different operating parameters such as MW-ECR power, annealing temperature and the doping level of the emitter region were varied. The n{sup +}-type emitter regions were obtained by phosphorus diffusion in a conventional furnace using an oxide doping source containing phosphorus (P507 or P509 solutions, from Filmtronics Inc.). The MW hydrogenation was carried out at a sample temperature of 400 C for 60 min. Both types of emitters formed from P507 and P509 showed V{sub oc} of 155 mV and 206 mV, which increased linearly to 305 mV and 331 mV, respectively, after hydrogenation when the MW power varied from 200 to 650 W. However, the sheet resistances of the n{sup +} emitter region showed a slight increase depending upon hydrogenation power because of its etching. In a further study, hydrogenated samples were annealed in neutral or forming gas (FG) and we observed interesting results on V{sub oc} in the presence of FG. The FG annealing temperature study revealed a strong dependence of V{sub oc} on MW power, which affected the etching level of emitter and emitter dopant concentration, which controls the diffusion of hydrogen ions during post-hydrogenation step. The results were explained in detail by combining the effects of MW power and dopant level of the emitter. (orig.)

  1. Zircaloy 4 ingots' industrial fabrication

    International Nuclear Information System (INIS)

    Leyt, A.

    1987-01-01

    The technology developed for the industrial fabrication of Zircaloy-4 ingots is presented. According to the results obtained: a) the homogeneity of the ingots is analyzed, regarding the distribution of components (tin, iron, chromium, oxygen) and Brinell hardness as a function of different types of charge: zirconium sponge-recycling alloy material, sponge of zirconium-alloy; b) the distribution of the same parameters as a function of production is also analyzed. (Author)

  2. Silicon materials outlook study for 1980-85 calendar years

    Energy Technology Data Exchange (ETDEWEB)

    Costogue, E.; Ferber, R.; Hasbach, W.; Pellin, R.; Yaws, C.

    1979-11-01

    Photovoltaic solar cell arrays converting solar energy into electrical energy can become a cost-effective, alternative energy source provided that an adequate supply of low-priced solar cell materials and automated fabrication techniques are available. Presently, the photovoltaic industry is dependent upon polycrystalline silicon which is produced primarily for the discrete semiconductor device industry. This dependency is expected to continue until DOE-sponsored new technology developments mature. Recent industry forecasts have predicted a limited supply of polycrystalline silicon material and a shortage could occur in the early 80's. The Jet Propulsion Laboratory's Technology Development and Application Lead Center formed an ad hoc committee at JPL, SERI and consultant personnel to conduct interviews with key polycrystalline manufacturers and a large cross-section of single crystal ingot growers and wafer manufacturers. Industry consensus and conclusions reached from the analysis of the data obtained by the committee are reported. The highlight of the study is that there is a high probability of polycrystalline silicon shortage by the end of CY 1982 and a strong seller's market after CY 1981 which will foster price competition for available silicon.

  3. Polycrystalline La1-xSrxMnO3 films on silicon: Influence of post-Deposition annealing on structural, (Magneto-)Optical, and (Magneto-)Electrical properties

    Science.gov (United States)

    Thoma, Patrick; Monecke, Manuel; Buja, Oana-Maria; Solonenko, Dmytro; Dudric, Roxana; Ciubotariu, Oana-Tereza; Albrecht, Manfred; Deac, Iosif G.; Tetean, Romulus; Zahn, Dietrich R. T.; Salvan, Georgeta

    2018-01-01

    The integration of La1-xSrxMnO3 (LSMO) thin film technology into established industrial silicon processes is regarded as challenging due to lattice mismatch, thermal expansion, and chemical reactions at the interface of LSMO and silicon. In this work, we investigated the physical properties of thin La0.73Sr0.27MnO3 films deposited by magnetron sputtering on silicon without a lattice matching buffer layer. The influence of a post-deposition annealing treatment on the structural, (magneto-)optical, and (magneto-)electrical properties was investigated by a variety of techniques. Using Rutherford backscattering spectroscopy, atomic force microscopy, Raman spectroscopy, and X-ray diffraction we could show that the thin films exhibit a polycrystalline, rhombohedral structure after a post-deposition annealing of at least 700 °C. The dielectric tensor in the spectral range from 1.7 eV to 5 eV determined from spectroscopic ellipsometry in combination with magneto-optical Kerr effect spectroscopy was found to be comparable to that of lattice matched films on single crystal substrates reported in literature [1]. The values of the metal-isolator transition temperature and temperature-dependent resistivities also reflect a high degree of crystalline quality of the thermally treated films.

  4. Leakage current suppression with a combination of planarized gate and overlap/off-set structure in metal-induced laterally crystallized polycrystalline-silicon thin-film transistors

    Science.gov (United States)

    Chae, Hee Jae; Seok, Ki Hwan; Lee, Sol Kyu; Joo, Seung Ki

    2018-04-01

    A novel inverted staggered metal-induced laterally crystallized (MILC) polycrystalline-silicon (poly-Si) thin-film transistors (TFTs) with a combination of a planarized gate and an overlap/off-set at the source-gate/drain-gate structure were fabricated and characterized. While the MILC process is advantageous for fabricating inverted staggered poly-Si TFTs, MILC TFTs reveal higher leakage current than TFTs crystallized by other processes due to their high trap density of Ni contamination. Due to this drawback, the planarized gate and overlap/off-set structure were applied to inverted staggered MILC TFTs. The proposed device shows drastic suppression of leakage current and pinning phenomenon by reducing the lateral electric field and the space-charge limited current from the gate to the drain.

  5. Characterization of nanometer-thick polycrystalline silicon with phonon-boundary scattering enhanced thermoelectric properties and its application in infrared sensors.

    Science.gov (United States)

    Zhou, Huchuan; Kropelnicki, Piotr; Lee, Chengkuo

    2015-01-14

    Although significantly reducing the thermal conductivity of silicon nanowires has been reported, it remains a challenge to integrate silicon nanowires with structure materials and electrodes in the complementary metal-oxide-semiconductor (CMOS) process. In this paper, we investigated the thermal conductivity of nanometer-thick polycrystalline silicon (poly-Si) theoretically and experimentally. By leveraging the phonon-boundary scattering, the thermal conductivity of 52 nm thick poly-Si was measured as low as around 12 W mK(-1) which is only about 10% of the value of bulk single crystalline silicon. The ZT of n-doped and p-doped 52 nm thick poly-Si was measured as 0.067 and 0.024, respectively, while most previously reported data had values of about 0.02 and 0.01 for a poly-Si layer with a thickness of 0.5 μm and above. Thermopile infrared sensors comprising 128 pairs of thermocouples made of either n-doped or p-doped nanometer-thick poly-Si strips in a series connected by an aluminium (Al) metal interconnect layer are fabricated using microelectromechanical system (MEMS) technology. The measured vacuum specific detectivity (D*) of the n-doped and p-doped thermopile infrared (IR) sensors are 3.00 × 10(8) and 1.83 × 10(8) cm Hz(1/2) W(-1) for sensors of 52 nm thick poly-Si, and 5.75 × 10(7) and 3.95 × 10(7) cm Hz(1/2) W(-1) for sensors of 300 nm thick poly-Si, respectively. The outstanding thermoelectric properties indicate our approach is promising for diverse applications using ultrathin poly-Si technology.

  6. Cast polycrystalline silicon photovoltaic module manufacturing technology improvements. Annual subcontract report, 1 January 1996--31 December 1996

    Energy Technology Data Exchange (ETDEWEB)

    Wohlgemuth, J. [Solarex Corp., Frederick, MD (United States)

    1997-10-01

    This report describes Solarex`s accomplishments during this phase of the Photovoltaic Manufacturing Technology (PVMaT) program. During this reporting period, Solarex researchers converted 79% of production casting stations to increase ingot size and operated them at equivalent yields and cell efficiencies; doubled the casting capacity at 20% the cost of buying new equipment to achieve the same capacity increase; operated the wire saws in a production mode with higher yields and lower costs than achieved on the ID saws; purchased additional wire saws; developed and qualified a new wire-guide coating material that doubles the wire-guide lifetime and produces significantly less scatter in wafer thickness; ran an Al paste back-surface-field process on 25% of all cells in manufacturing; completed environmental qualification of modules using cells produced by an all-print metallization process; qualified a vendor-supplied Tedlar/ethylene vinyl acetate (EVA) laminate to replace the combination of separate sheets of EVA and Tedlar backsheet; substituted RTV adhesive for the 3M Very High Bond tape after several field problems with the tape; demonstrated the operation of a prototype unit to trim/lead attach/test modules; demonstrated the use of light soldering for solar cells; demonstrated the operation of a wafer pull-down system for cassetting wet wafers; and presented three PVMaT-related papers at the 25th IEEE Photovoltaic Specialists Conference.

  7. Morphology and electronic transport of polycrystalline silicon films deposited by SiF sub 4 /H sub 2 at a substrate temperature of 200 deg. C

    CERN Document Server

    Hazra, S; Ray, S

    2002-01-01

    Undoped and phosphorous doped polycrystalline silicon (poly-Si) films were deposited using a SiF sub 4 /H sub 2 gas mixture at a substrate temperature of 200 deg. C by radio frequency plasma enhanced chemical vapor deposition (rf-PECVD). Fourier transform infrared (FTIR) spectroscopy and x-ray diffraction (XRD) experiments reveal that the present poly-Si films are equivalent to the poly-Si films deposited at high temperature (>600 deg. C). XRD and scanning electron microscope observations show that the crystalline quality of slightly P-doped film is better compared to that of undoped poly-Si films. Phosphorus atom concentration in the slightly P-doped poly-Si film is 5.0x10 sup 1 sup 6 atoms/cm sup 3. Association of a few phosphorous atoms in the silicon matrix enhances crystallization as eutectic-forming metals do. Dark conductivity of slightly P-doped film is 4 orders of magnitude higher, although mobility-lifetime product (eta mu tau) is 2 orders of magnitude lower than that of undoped film. The presence o...

  8. Near single-crystalline, high-carrier-mobility silicon thin film on a polycrystalline/amorphous substrate

    Science.gov (United States)

    Findikoglu, Alp T [Los Alamos, NM; Jia, Quanxi [Los Alamos, NM; Arendt, Paul N [Los Alamos, NM; Matias, Vladimir [Santa Fe, NM; Choi, Woong [Los Alamos, NM

    2009-10-27

    A template article including a base substrate including: (i) a base material selected from the group consisting of polycrystalline substrates and amorphous substrates, and (ii) at least one layer of a differing material upon the surface of the base material; and, a buffer material layer upon the base substrate, the buffer material layer characterized by: (a) low chemical reactivity with the base substrate, (b) stability at temperatures up to at least about 800.degree. C. under low vacuum conditions, and (c) a lattice crystal structure adapted for subsequent deposition of a semiconductor material; is provided, together with a semiconductor article including a base substrate including: (i) a base material selected from the group consisting of polycrystalline substrates and amorphous substrates, and (ii) at least one layer of a differing material upon the surface of the base material; and, a buffer material layer upon the base substrate, the buffer material layer characterized by: (a) low chemical reactivity with the base substrate, (b) stability at temperatures up to at least about 800.degree. C. under low vacuum conditions, and (c) a lattice crystal structure adapted for subsequent deposition of a semiconductor material, and, a top-layer of semiconductor material upon the buffer material layer.

  9. Development in fiscal 1998 of silicon manufacturing process to rationalize energy usage. Surveys and researches on analysis of practical application of technology to manufacture silicon raw materials for solar cells; 1998 nendo energy shiyo gorika silicon seizo process kaihatsu seika hokokusho. Taiyo denchi silicon genryo seizo gijutsu no jitsuyoka kaiseki ni kansuru chosa kenkyu

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    1999-03-01

    With an objective to develop a mass production technology to manufacture silicon raw materials for solar cells, and assist its practical application, surveys and analyses were performed on trends in development of the related technologies, the problems therein , market trends and industrial trends thereof. This paper summarizes the achievements in fiscal 1998. The worldwide production amount of solar cells in 1998 is estimated to have achieved 150 MW, and the silicon consumption reached the level of 2,300 tons. In spite of the economic recession environment, there was no change in the expansion trend. In developing an SOG-Si mass production and manufacturing technology, construction of pilot plants for each process has been completed, and entered into the operation research phase. In developing a technology to manufacture high quality poly-crystalline silicon substrates, fabrication has been completed on the on-line ingot cutting equipment and the plasma heating equipment, and the stage is now in operation research of continuous electromagnetic casting process. The conversion efficiency of the poly-crystalline silicon solar cells is 14 to 16% at the mass production level, whose enhancement requires indispensably the improvement in quality of the substrate. Discussions are required on the ingot manufacturing conditions in coordination with improvement in the cell manufacturing technology. (NEDO)

  10. Vacuum induction melting of uranium ingots

    International Nuclear Information System (INIS)

    Hussain, M.M.; Bagchi, S.N.; Singh, S.P.

    1992-01-01

    Massive uranium ingot is produced from green salt (UF 4 ) using calciothermic reduction (CTR) or magnesiothermic reduction (MTR) process. CTR process has been replaced by MTR process at Trombay due to economic considerations. This paper highlights problems associated with the vacuum induction melting of MTR ingots and the remedial measures taken to produce good quality billets. Details of metallographic examination of inclusions in ingots and billets have been incorporated. (author). 3 figs

  11. Extraction of Kinetic Parameters for the Chemical Vapor Deposition of Polycrystalline Silicon at Medium and Low Pressures

    NARCIS (Netherlands)

    Holleman, J.; Verweij, J.F.; Verweij, Jan F.

    1993-01-01

    The deposition of silicon (Si) from silane (SiH4) was studied in the silane pressure range from 0.5 to 100 Pa (0.005 to1 mbar) and total pressure range from 10 to 1000 Pa using N2 or He as carrier gases. The two reaction paths, namely,heterogeneous and homogeneous decomposition could be separated by

  12. Fast Pulling of n-Type Si Ingots for Enhanced Si Solar Cell Production

    Science.gov (United States)

    Kim, Kwanghun; Park, Sanghyun; Park, Jaechang; Pang, Ilsun; Ryu, Sangwoo; Oh, Jihun

    2018-03-01

    Reducing the manufacturing costs of silicon substrates is an important issue in the silicon-based solar cell industry. In this study, we developed a high-throughput ingot growth method by accelerating the pulling speed in the Czochralski process. By controlling the heat flow of the ingot growth chamber and at the solid-liquid interfaces, the pulling speed of an ingot could be increased by 15% compared to the conventional method, while retaining high quality. The wafer obtained at a high pulling speed showed an enhanced minority carrier lifetime compared with conventional wafers, due to the vacancy passivation effect, and also demonstrated comparable bulk resistivity and impurities. The results in this work are expected to open a new way to enhance the productivity of Si wafers used for Si solar cells, and therefore, to reduce the overall manufacturing cost.

  13. Influence of Grain Structure and Doping on the Deformation and Fracture of Polycrystalline Silicon for MEMS and NEMS

    Science.gov (United States)

    2012-09-03

    described in previous reports [32]. In this experimental technique, the specimen ends are gripped to loadcell and PZT actuator mounted on three dimensional...shown in Figure 3. This was due to the random distribution of columnar grains with different texture where KIC was dependent on one particular grain...Engineering: A, 268 (1-2), pp. 116-126, 1999 [19] C.P. Chen, and M.H. Leipold, "Fracture toughness of silicon", American Ceramics Society Bulletin

  14. Thin film polycrystalline silicon solar cells. Quarterly technical progress report No. 3, 1 April 1980-30 June 1980

    Energy Technology Data Exchange (ETDEWEB)

    Sarma, K. R.; Rice, M. J.; Legge, R.; Ellis, R. J.

    1980-06-01

    During this third quarter of the program, the high pressure plasma (hpp) deposition process has been thoroughly evaluated using SiHCl/sub 3/ and SiCl/sub 4/ silicon source gases, by the gas chromatographic analysis of the effluent gases from the reactor. Both the deposition efficiency and reactor throughput rate were found to be consistently higher for hpp mode of operation compared to conventional CVD mode. The figure of merit for various chlorosilanes as a silicon source gas for hpp deposition is discussed. A new continuous silicon film deposition scheme is developed, and system design is initiated. This new system employs gas interlocks and eliminates the need for gas curtains which have been found to be problematic. Solar cells (2 cm x 2 cm area) with AM1 efficiencies of up to 12% were fabricated on RTR grain enhanced hpp deposited films. The parameters of a 12% cell under simulated AM1 illumination were: V/sub OC/ = 0.582 volts, J/sub SC/ = 28.3 mA/cm/sup 2/ and F.F. = 73.0%.

  15. Influence of temperature on power output of a panel of polycrystalline silicon in the west region of Parana, Brazil; Influencia da temperatura sobre a potencia de saida de um painel de silicio policristalino na regiao oeste paranaense

    Energy Technology Data Exchange (ETDEWEB)

    Michels, Roger Nabeyama; Santos, Jose Airton Azevedo dos; Gnoatto, Estor; Kawanagh, Edward; Fischborn, Marcos [Universidade Tecnologica Federal do Parana (UTFPR), Medianeira, PR (Brazil); Halmeman, Maria Cristina Rodrigues [Universidade Estadual Paulista (UNESP), Botucatu, SP (Brazil)

    2008-07-01

    Photovoltaic panels have been confirmed as an alternative source of electric energy. However, the output power of a photovoltaic panel is strongly dependent on solar intensity modifications and ambient temperature too. Then, it is necessary to know like the panels work under these alterations. This work intend to analyze the influence of the temperature on the output power of a polycrystalline silicon photovoltaic panel in Medianeira City located in West Region of Parana State by one year observation period. (author)

  16. High-performance flexible thin-film transistors fabricated using print-transferrable polycrystalline silicon membranes on a plastic substrate

    International Nuclear Information System (INIS)

    Qin, Guoxuan; Yuan, Hao-Chih; Ma, Zhenqiang; Yang, Hongjun; Zhou, Weidong

    2011-01-01

    Inexpensive polycrystalline Si (poly-Si) with large grain size is highly desirable for flexible electronics applications. However, it is very challenging to directly deposit high-quality poly-Si on plastic substrates due to processing constrictions, such as temperature tolerance and residual stress. In this paper, we present our study on poly-Si membranes that are stress free and most importantly, are transferrable to any substrate including a low-temperature polyethylene terephthalate (PET) substrate. We formed poly-Si-on-insulator by first depositing small-grain size poly-Si on an oxidized Si wafer. We then performed high-temperature annealing for recrystallization to obtain larger grain size. After selective doping on the poly-Si-on-insulator, buried oxide was etched away. By properly patterning the poly-Si layer, residual stress in the released poly-Si membranes was completely relaxed. The flat membrane topology allows the membranes to be print transferred to any substrates. High-performance TFTs were demonstrated on the transferred poly-Si membranes on a PET substrate

  17. Development of a rapid thermal annealing process for polycrystalline silicon thin-film solar cells on glass

    Energy Technology Data Exchange (ETDEWEB)

    Rau, B. [Helmholtz Centre Berlin for Materials and Energy, Kekulestr. 5, D-12489 Berlin (Germany)], E-mail: bjoern.rau@helmholtz-berlin.de; Weber, T.; Gorka, B.; Dogan, P.; Fenske, F.; Lee, K.Y.; Gall, S.; Rech, B. [Helmholtz Centre Berlin for Materials and Energy, Kekulestr. 5, D-12489 Berlin (Germany)

    2009-03-15

    In this report, we discuss the influence of rapid thermal annealing (RTA) on the performance of polycrystalline Si (poly-Si) thin-film solar cells on glass where the poly-Si layers are differently prepared. The first part presents a comprehensive study of RTA treatments on poly-Si thin-films made by solid phase crystallization (SPC) (standard material of CSG Solar AG, Thalheim). By varying both plateau temperature (up to 1050 deg. C) and duration (up to 1000 s) of the annealing profile, we determined the parameters for a maximum open-circuit voltage (V{sub OC}). In addition, we applied our standard plasma hydrogenation treatment in order to passivate the remaining intra-grain defects and grain boundaries by atomic hydrogen resulting in a further increase of V{sub OC}. We found, that the preceding RTA treatment increases the effect of hydrogenation already at comparable low RTA temperatures. The effect on hydrogenation increases significantly with RTA temperature. In a second step we investigated the effect of the RTA and hydrogenation on large-grained poly-Si films based on the epitaxial thickening of poly-Si seed layers.

  18. An effective approach for restraining electrochemical corrosion of polycrystalline silicon caused by an HF-based solution and its application for mass production of MEMS devices

    International Nuclear Information System (INIS)

    Liu, Yunfei; Xie, Jing; Zhao, Hui; Luo, Wei; Yang, Jinling; An, Ji; Yang, Fuhua

    2012-01-01

    This paper presents a novel method to effectively protect the structural material polycrystalline silicon (polysilicon) from electrochemical corrosion, which often occurs when the MEMS device is released in HF-based solutions, especially when the device contains a noble metal. This corrosion seriously degrades the electrical and mechanical performance as well as the reliability of MEMS devices. In this method, a photoresist (PR) is employed to cover the noble metal, which is electrically coupled with the underlying polysilicon layer. This PR cover can effectually prevent an HF-based solution from diffusing through and arriving at the surface of the noble metal, thus cutting off the electrical current of the electrochemical corrosion reaction. The polysilicon is well protected for longer than 80 min in 49% concentrated HF solutions by a 3 µm-thick AZ 6130 PR film. This fabrication process is simple, reliable and suitable for mass production of high-end micromechanical disk resonators. Benefiting from the technology breakthrough mentioned above, a novel low-cost microfabrication method for disk resonators with high performance has been developed, and the VHF polysilicon disk resonators with resonance frequencies around 282 MHz and Q values larger than 2000 at atmosphere have been produced at wafer level. (paper)

  19. Enhanced extraction of silicon-vacancy centers light emission using bottom-up engineered polycrystalline diamond photonic crystal slabs

    Czech Academy of Sciences Publication Activity Database

    Ondič, Lukáš; Varga, Marián; Hruška, Karel; Fait, J.; Kapusta, Peter

    2017-01-01

    Roč. 11, č. 3 (2017), s. 2972-2981 ISSN 1936-0851 R&D Projects: GA ČR GJ16-09692Y; GA MŠk LD15003; GA ČR(CZ) GBP208/12/G016 Institutional support: RVO:68378271 ; RVO:61388955 Keywords : photonic crystal * diamond * silicon vacancy center Subject RIV: BM - Solid Matter Physics ; Magnetism; CF - Physical ; Theoretical Chemistry (UFCH-W) OBOR OECD: Condensed matter physics (including formerly solid state physics, supercond.); Physical chemistry (UFCH-W) Impact factor: 13.942, year: 2016

  20. Application of polycrystalline diffusion barriers

    International Nuclear Information System (INIS)

    Tsymbal, V.A.; Kolupaev, I.N.

    2010-01-01

    Degradation of contacts of the electronic equipment at the raised temperatures is connected with active diffusion redistribution of components contact - metalized systems (CMS) and phase production on interphase borders. One of systems diffusion barriers (DB) are polycrystalline silicide a film, in particular silicides of the titan. Reception disilicide the titan (TiSi 2 ) which on the parameters is demanded for conditions of microelectronics from known silicides of system Ti-Si, is possible as a result of direct reaction of a film of the titan and a substrate of silicon, and at sedimentation of layer Ti-Si demanded stoichiometric structure. Simultaneously there is specific problem polycrystalline diffusion a barrier (PDB): the polycrystalline provides structural balance and metastability film disilicide, but leaves in it borders of grains - easy local ways of diffusion. In clause the analysis diffusion permeability polycrystalline and polyphase DB is made and recommendations for practical methods of increase of blocking properties PDB are made.

  1. Radiometric study of creep in ingot rolling

    International Nuclear Information System (INIS)

    Kubicek, P.; Zamyslovsky, Z.; Uherek, J.

    The radiometric study of creep during ingot rolling performed in the rolling mill of the Vitkovice Iron and Steel Works and the first results are described. Selected sites in 3 to 8 ton ingots were labelled with 2 to 3.7x10 5 Bq of 60 Co and after rolling into blocks, the transposition of the labelled sites of the ingots was investigated. The results indicate creep during rolling, local extension in certain sites under study and help to determine the inevitable bottom crop incurred in the forming. Finally, the requirements put on the radiometric apparatus for the next stages of technological research are presented. (author)

  2. Modelling of defects in ingot forging

    DEFF Research Database (Denmark)

    Christiansen, Peter

    The present report presents an investigation of the ingot forging process with special emphasis on modelling the influence of die geometry on the soundness of the ingot after hot forging. An investigation on how to model damage is also performed. The influence of the lower die angle is quantified...... angle of 130o-140o giving rise to the largest centreline porosity closure regardless of material hardening behaviour applied. Friction was found only to have minor influence on the optimum. Multi stroke forging operations have also been modelled since the ingot forging process consists of many forging...... damage. It is found that when evaluating damage only by relative density; feed size and lower die angle does not influence whether the hot forging process is successful or not. This is in disagreement with the general understanding of the ingot forging process. When evaluating ductile damage...

  3. Dehydrogenation in large ingot casting process

    International Nuclear Information System (INIS)

    Ubukata, Takashi; Suzuki, Tadashi; Ueda, Sou; Shibata, Takashi

    2009-01-01

    Forging components (for nuclear power plants) have become larger and larger because of decreased weld lines from a safety point of view. Consequently they have been manufactured from ingots requirement for 200 tons or more. Dehydrogenation is one of the key issues for large ingot manufacturing process. In the case of ingots of 200 tons or heavier, mold stream degassing (MSD) has been applied for dehydrogenation. Although JSW had developed mold stream degassing by argon (MSD-Ar) as a more effective dehydrogenating practice, MSD-Ar was not applied for these ingots, because conventional refractory materials of a stopper rod for the Ar blowing hole had low durability. In this study, we have developed a new type of stopper rod through modification of both refractory materials and the stopper rod construction and have successfully expanded the application range of MSD-Ar up to ingots weighting 330 tons. Compared with the conventional MSD, the hydrogen content in ingots after MSD-Ar has decreased by 24 percent due to the dehydrogenation rate of MSD-Ar increased by 34 percent. (author)

  4. Primary Structure and Mechanical Properties of AlSi2 Alloy Continuous Ingots

    Directory of Open Access Journals (Sweden)

    Wróbel T.

    2017-06-01

    Full Text Available The paper presents the research results of horizontal continuous casting of ingots of aluminium alloy containing 2% wt. silicon (AlSi2. Together with the casting velocity (velocity of ingot movement we considered the influence of electromagnetic stirring in the area of the continuous casting mould on refinement of the ingot’s primary structure and their selected mechanical properties, i.e. tensile strength, yield strength, hardness and elongation. The effect of primary structure refinement and mechanical properties obtained by electromagnetic stirring was compared with refinement obtained by using traditional inoculation, which consists in introducing additives, i.e. Ti, B and Sr, to the metal bath. On the basis of the obtained results we confirmed that inoculation done by electromagnetic stirring in the range of the continuous casting mould guarantees improved mechanical properties and also decreases the negative influence of casting velocity, thus increasing the structure of AlSi2 continuous ingots.

  5. Direct growth of large grain polycrystalline silicon films on aluminum-induced crystallization seed layer using hot-wire chemical vapor deposition

    International Nuclear Information System (INIS)

    Wu, Bing-Rui; Lo, Shih-Yung; Wuu, Dong-Sing; Ou, Sin-Liang; Mao, Hsin-Yuan; Wang, Jui-Hao; Horng, Ray-Hua

    2012-01-01

    Large grain polycrystalline silicon (poly-Si) films on glass substrates have been deposited on an aluminum-induced crystallization (AIC) seed layer using hot-wire chemical vapor deposition (HWCVD). A poly-Si seed layer was first formed by the AIC process and a thicker poly-Si film was subsequently deposited upon the seed layer using HWCVD. The effects of AIC annealing parameters on the structural and electrical properties of the poly-Si seed layers were characterized by Raman scattering spectroscopy, field-emission scanning electron microscopy, and Hall measurements. It was found that the crystallinity of seed layer was enhanced with increasing the annealing duration and temperature. The poly-Si seed layer formed at optimum annealing parameters can reach a grain size of 700 nm, hole concentration of 3.5 × 10 18 cm −3 , and Hall mobility of 22 cm 2 /Vs. After forming the seed layer, poly-Si films with good crystalline quality and high growth rate (> 1 nm/s) can be obtained using HWCVD. These results indicated that the HWCVD-deposited poly-Si film on an AIC seed layer could be a promising candidate for thin-film Si photovoltaic applications. - Highlights: ►Poly-Si seed layers are formed by aluminum-induced crystallization (AIC) process. ►Poly-Si on AIC seed layers are prepared by hot-wire chemical vapor deposition. ►AIC process parameters affect structural properties of poly-Si films. ►Increasing the annealing duration and temperature increases the film crystallinity.

  6. Development in fiscal 1999 of technologies to put photovoltaic power generation systems into practical use. Development of thin film solar cell manufacturing technologies (Development of low-cost large-area module manufacturing technologies, and development of technologies to manufacture amorphous silicon/thin film poly-crystalline silicon hybrid thin film solar cells); 1999 nendo taiyoko hatsuden system jitsuyoka gijutsu kaihatsu seika hokokusho. Usumaku taiyo denchi no seizo gijutsu kaihatsu (tei cost daimenseki module seizo kaihatsu (oyogata shinkozo usumaku taiyo denchi no seizo gijutsu kaihatsu (amorphous silicon / usumaku takessho silicon hybrid usumaku taiyo denchi no seizo gijutsu kaihatsu))

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2000-03-01

    Developmental research has been performed on large-area low-cost manufacturing technologies on hybrid thin film solar cells of amorphous silicon and poly-crystalline silicon. This paper summarizes the achievements in fiscal 1999. The research has been performed on a texture construction formed naturally on silicon surface, and thin film poly-crystalline silicon cells with STAR structure having a rear side reflection layer to increase light absorption. The research achievements during the current fiscal year may be summarized as follows: the laser scribing technology for thin film poly-crystalline silicon was established, which is important for modularization, making fabrication of low-cost and large-area modules possible; a stabilization efficiency of 11.3% was achieved in a hybrid mini module comprising of ten-stage series integrated amorphous silicon and thin film poly-crystalline silicon; structures different hybrid modules were discussed, whereas an initial efficiency of 10.3% (38.78W) was achieved in a sub-module having a substrate size of 910 mm times 455 mm; and feasibility of forming large-area hybrid modules was demonstrated. (NEDO)

  7. Effect of annealing temperature on the thermal stress and dislocation density of mc-Si ingot grown by DS process for solar cell application

    Science.gov (United States)

    Sanmugavel, S.; Srinivasan, M.; Aravinth, K.; Ramasamy, P.

    2018-04-01

    90% of the solar industries are using crystalline silicon. Cost wise the multi-crystalline silicon solar cells are better compared to mono crystalline silicon. But because of the presence of grain boundaries, dislocations and impurities, the efficiency of the multi-crystalline silicon solar cells is lower than that of mono crystalline silicon solar cells. By reducing the defect and dislocation we can achieve high conversion efficiency. The velocity of dislocation motion increases with stress. By annealing the grown ingot at proper temperature we can decrease the stress and dislocation. Our simulation results show that the value of stress and dislocation density is decreased by annealing the grown ingot at 1400K and the input parameters can be implemented in real system to grow a better mc-Si ingot for energy harvesting applications.

  8. Buried oxide layer in silicon

    Science.gov (United States)

    Sadana, Devendra Kumar; Holland, Orin Wayne

    2001-01-01

    A process for forming Silicon-On-Insulator is described incorporating the steps of ion implantation of oxygen into a silicon substrate at elevated temperature, ion implanting oxygen at a temperature below 200.degree. C. at a lower dose to form an amorphous silicon layer, and annealing steps to form a mixture of defective single crystal silicon and polycrystalline silicon or polycrystalline silicon alone and then silicon oxide from the amorphous silicon layer to form a continuous silicon oxide layer below the surface of the silicon substrate to provide an isolated superficial layer of silicon. The invention overcomes the problem of buried isolated islands of silicon oxide forming a discontinuous buried oxide layer.

  9. Polycrystalline strengthening

    DEFF Research Database (Denmark)

    Hansen, Niels

    1985-01-01

    for the understanding of polycrystalline strengthening is obtained mainly from surface relief patterns and from bulk structures observed by transmission electron microscopy of thin foils. The results obtained by these methods are discussed and correlations are proposed. A number of features characterizing the deformed...... structure are summarized and the behavior of a number of metals and alloys is reviewed with emphasis on the structural changes in the interior of the grains and in the vicinity of the grain boundaries. The models for strain accommodation during deformation are discussed on the basis of the microstructures...

  10. Silicon Sheet Growth Development for the Large Area Sheet Task of the Low Cost Solar Array Project. Heat Exchanger Method - Ingot Casting Fixed Abrasive Method - Multi-Wire Slicing

    Science.gov (United States)

    Schmid, F.; Khattak, C. P.

    1978-01-01

    Solar cells fabricated from HEM cast silicon yielded up to 15% conversion efficiencies. This was achieved in spite of using unpurified graphite parts in the HEM furnace and without optimization of material or cell processing parameters. Molybdenum retainers prevented SiC formation and reduced carbon content by 50%. The oxygen content of vacuum cast HEM silicon is lower than typical Czochralski grown silicon. Impregnation of 45 micrometers diamonds into 7.5 micrometers copper sheath showed distortion of the copper layer. However, 12.5 micrometers and 15 micrometers copper sheath can be impregnated with 45 micrometers diamonds to a high concentration. Electroless nickel plating of wires impregnated only in the cutting edge showed nickel concentration around the diamonds. This has the possibility of reducing kerf. The high speed slicer fabricated can achieve higher speed and longer stroke with vibration isolation.

  11. Self-Anchored Catalyst Interface Enables Ordered Via Array Formation from Submicrometer to Millimeter Scale for Polycrystalline and Single-Crystalline Silicon.

    Science.gov (United States)

    Kim, Jeong Dong; Kim, Munho; Kong, Lingyu; Mohseni, Parsian K; Ranganathan, Srikanth; Pachamuthu, Jayavel; Chim, Wai Kin; Chiam, Sing Yang; Coleman, James J; Li, Xiuling

    2018-03-14

    Defying text definitions of wet etching, metal-assisted chemical etching (MacEtch), a solution-based, damage-free semiconductor etching method, is directional, where the metal catalyst film sinks with the semiconductor etching front, producing 3D semiconductor structures that are complementary to the metal catalyst film pattern. The same recipe that works perfectly to produce ordered array of nanostructures for single-crystalline Si (c-Si) fails completely when applied to polycrystalline Si (poly-Si) with the same doping type and level. Another long-standing challenge for MacEtch is the difficulty of uniformly etching across feature sizes larger than a few micrometers because of the nature of lateral etching. The issue of interface control between the catalyst and the semiconductor in both lateral and vertical directions over time and over distance needs to be systematically addressed. Here, we present a self-anchored catalyst (SAC) MacEtch method, where a nanoporous catalyst film is used to produce nanowires through the pinholes, which in turn physically anchor the catalyst film from detouring as it descends. The systematic vertical etch rate study as a function of porous catalyst diameter from 200 to 900 nm shows that the SAC-MacEtch not only confines the etching direction but also enhances the etch rate due to the increased liquid access path, significantly delaying the onset of the mass-transport-limited critical diameter compared to nonporous catalyst c-Si counterpart. With this enhanced mass transport approach, vias on multistacks of poly-Si/SiO 2 are also formed with excellent vertical registry through the polystack, even though they are separated by SiO 2 which is readily removed by HF alone with no anisotropy. In addition, 320 μm square through-Si-via (TSV) arrays in 550 μm thick c-Si are realized. The ability of SAC-MacEtch to etch through poly/oxide/poly stack as well as more than half millimeter thick silicon with excellent site specificity for a wide

  12. Design Concept of Kijang Research Reactor for Neutron Transmutation Doping of 300 MM ingots

    International Nuclear Information System (INIS)

    Jun, B. J.; Kim, H. S.; Seo, C. G.; Kim, H. C.; Lee, B. C.

    2013-01-01

    Neutron transmutation doping will be one of the important utilization areas of the Kijang research reactor, which is currently under design. The reactor will serve for at least 50 years. As the diameter of a current NTD ingot is already large compared to the size of the reactor, unless a provision in the reactor design is specifically made for the irradiation of potential larger diameter ingots in the future, the lifetime sustainability of the NTD activity, if possible, may be difficult to achieve. While 200 mm became the largest diameter of NTD wafers a few years ago, 300 mm is the majority nowadays in the silicon semiconductor market, and one of the world leading device companies recently invested in the construction of a 450 mm fabrication plant. The usual peak time of a wafer diameter has been around 12 years. Though the generation gap of a NTD wafer diameter has become longer as time has passed, we can foresee that NTD demand for 300 mm ingots will arise within 20 years if their NTD is possible. Our calculations show that the radial uniformity for the 300 mm ingot irradiation may be acceptable by wafer companies. However, the NTD for 450 mm ingots is judged as impractical. The KJRR is designed to irradiate 6' and 200 mm ingots to accommodate the major demands in the current and near future markets. We suppose that a 6' irradiation facility will be modified into a 300 mm irradiation facility when the demand for a 300 mm NTD arises. As the demand for the 300 mm NTD increases, other 6' and 200 mm NTD facilities will be modified one by one. A minimization of the component replacement and long-lived radwaste and a facilitation of the replacement work for each modification are important factors along with a better performance of NTD facilities

  13. Large grain cavities from pure niobium ingot

    Science.gov (United States)

    Myneni, Ganapati Rao [Yorktown, VA; Kneisel, Peter [Williamsburg, VA; Cameiro, Tadeu [McMurray, PA

    2012-03-06

    Niobium cavities are fabricated by the drawing and ironing of as cast niobium ingot slices rather than from cold rolled niobium sheet. This method results in the production of niobium cavities having a minimum of grain boundaries at a significantly reduced cost as compared to the production of such structures from cold rolled sheet.

  14. Fiscal 2000 achievement report. Development of energy use rationalization-oriented silicon manufacturing process (Development of silicon substrate manufacturing technology for high-quality solar cell); 2000 nendo shin energy sangyo gijutsu sogo kaihatsu kiko kyodo kenkyu gyomu seika hokokusho. Energy shiyo gorika silicon seizo process kaihatsu (Kohinshitsu taiyodenchiyou silicon kiban seizo gijutsu no kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2001-03-01

    Research and development was conducted for enhancing productivity and energy conservation by rendering continuous and automatic the electromagnetic casting process for manufacturing polycrystalline silicon substrates for solar cells. In the manufacture of ingots for substrates by continuous electromagnetic casting, the chuck type system for feeding power to the melt plasma was replaced by a roller type system, and the power feeding position was moved to the high temperature region. Also, an on-line ingot slicing technique was established. In the manufacture of substrates at a slicing rate of 300 {mu}m/minute, productivity of 115,000 wafers/month, yield of 98%, and thickness tolerance of 30 {mu}m were achieved. A high-speed cleaning technique was developed using a jet stream, by which the cleaning time was reduced to 5 minutes and the slurry recovery rate was elevated to 95%. Based on these, substrate-related costs in the case of 100 MW/year production was calculated, which resulted in a cost of 98.8 yen/wafer (target: 103.3 yen/wafer) for manufacturing 15 cm square substrates from ingots and in a 15 cm square substrate slicing and cleaning cost of 135.1 yen/wafer (target: 135.4 yen/wafer). (NEDO)

  15. Operation of arc heating furnace on manufacturing gigantic ingots and segregation of gigantic ingots

    International Nuclear Information System (INIS)

    Niimi, Takayasu; Okamura, Masayoshi

    1976-01-01

    The techniques and procedure for manufacturing gigantic ingots heavier than 200 t are described. Especially, practical results of an arc heating furnace which plays an important role in the procedure and segregation of gigantic ingots are discussed in detail. By appropriate operations of the arc heating furnance, hydrogen and phosphorus are kept unchanged, and oxygen and sulphur decrease to very low levels. Furthermore, the temperature can be accurately controlled. The application of multipour technique reduces segregation and its degree is dependent on kinds of steel. V-segregation and inverted V-segregation in steel deoxidized with carbon in vacuum seem to be very slight. (auth.)

  16. Characterization of HEM silicon for solar cells. [Heat Exchanger Method

    Science.gov (United States)

    Dumas, K. A.; Khattak, C. P.; Schmid, F.

    1981-01-01

    The Heat Exchanger Method (HEM) is a promising low-cost ingot casting process for material used for solar cells. This is the only method that is capable of casting single crystal ingots with a square cross section using a directional solidification technique. This paper describes the chemical, mechanical and electrical properties of the HEM silicon material as a function of position within the ingot.

  17. The Linear Thermal Expansion of Bulk Nanocrystalline Ingot Iron from Liquid Nitrogen to 300 K.

    Science.gov (United States)

    Wang, S G; Mei, Y; Long, K; Zhang, Z D

    2009-09-17

    The linear thermal expansions (LTE) of bulk nanocrystalline ingot iron (BNII) at six directions on rolling plane and conventional polycrystalline ingot iron (CPII) at one direction were measured from liquid nitrogen temperature to 300 K. Although the volume fraction of grain boundary and residual strain of BNII are larger than those of CPII, LTE of BNII at the six measurement directions were less than those of CPII. This phenomenon could be explained with Morse potential function and the crystalline structure of metals. Our LTE results ruled out that the grain boundary and residual strain of BNII did much contribution to its thermal expansion. The higher interaction potential energy of atoms, the less partial derivative of interaction potential energy with respect to temperature T and the porosity free at the grain boundary of BNII resulted in less LTE in comparison with CPII from liquid nitrogen temperature to 300 K. The higher LTE of many bulk nanocrystalline materials resulted from the porosity at their grain boundaries. However, many authors attributed the higher LTE of many nanocrystalline metal materials to their higher volume fraction of grain boundaries.

  18. The Linear Thermal Expansion of Bulk Nanocrystalline Ingot Iron from Liquid Nitrogen to 300 K

    Directory of Open Access Journals (Sweden)

    Mei Y

    2009-01-01

    Full Text Available Abstract The linear thermal expansions (LTE of bulk nanocrystalline ingot iron (BNII at six directions on rolling plane and conventional polycrystalline ingot iron (CPII at one direction were measured from liquid nitrogen temperature to 300 K. Although the volume fraction of grain boundary and residual strain of BNII are larger than those of CPII, LTE of BNII at the six measurement directions were less than those of CPII. This phenomenon could be explained with Morse potential function and the crystalline structure of metals. Our LTE results ruled out that the grain boundary and residual strain of BNII did much contribution to its thermal expansion. The higher interaction potential energy of atoms, the less partial derivative of interaction potential energy with respect to temperature T and the porosity free at the grain boundary of BNII resulted in less LTE in comparison with CPII from liquid nitrogen temperature to 300 K. The higher LTE of many bulk nanocrystalline materials resulted from the porosity at their grain boundaries. However, many authors attributed the higher LTE of many nanocrystalline metal materials to their higher volume fraction of grain boundaries.

  19. The electrochemical corrosion of bulk nanocrystalline ingot iron in HCl solutions with different concentrations

    International Nuclear Information System (INIS)

    Wang, S.G.; Sun, M.; Cheng, P.C.; Long, K.

    2011-01-01

    Highlights: → The corrosion resistance of BNII was enhanced in comparison with CPII in 0.1-0.4 mol L -1 solution. → The function work of BNII is 0.47 eV larger that of CPII. → The energy state density of 4s electrons of BNII is 13.73% less than that of CPII. → BNII corrosion resistance was enhanced due to its larger work function and less 4s electrons weight. → The specific adsorption of Cl - on BNII was weaker than that of CPII due to its larger function work. - Abstract: We studied the corrosion properties of bulk nanocrystalline ingot iron (BNII) and conventional polycrystalline ingot iron (CPII) in HCl solutions from 0.1 mol L -1 to 0.4 mol L -1 at room temperature. The corrosion resistance of BNII was enhanced in comparison with CPII. We investigated the surface energy state densities of BNII and CPII with ultra-violet photoelectron spectroscopy. The energy state density of BNII 4s electrons was 13.73% less than that of CPII. The function work of BNII was 0.47 eV larger that of CPII. The corrosion resistance of BNII was enhanced in comparison with CPII due to its less energy state density of 4s electrons, larger work function and weaker Cl - specific adsorption.

  20. Authorized limits for Fernald copper ingots

    Energy Technology Data Exchange (ETDEWEB)

    Frink, N.; Kamboj, S.; Hensley, J.; Chen, S. Y.

    1997-09-01

    This development document contains data and analysis to support the approval of authorized limits for the unrestricted release of 59 t of copper ingots containing residual radioactive material from the U.S. Department of Energy (DOE) Fernald Environmental Management Project (FEMP). The analysis presented in this document comply with the requirements of DOE Order 5400.5, {open_quotes}Radiation Protection of the Public and the Environment,{close_quotes} as well as the requirements of the proposed promulgation of this order as 10 CFR Part 834. The document was developed following the step-by-step process described in the Draft Handbook for Controlling Release for Reuse or Recycle Property Containing Residual Radioactive Material.

  1. Authorized limits for Fernald copper ingots

    International Nuclear Information System (INIS)

    Frink, N.; Kamboj, S.; Hensley, J.; Chen, S.Y.

    1997-09-01

    This development document contains data and analysis to support the approval of authorized limits for the unrestricted release of 59 t of copper ingots containing residual radioactive material from the U.S. Department of Energy (DOE) Fernald Environmental Management Project (FEMP). The analysis presented in this document comply with the requirements of DOE Order 5400.5, open-quotes Radiation Protection of the Public and the Environment,close quotes as well as the requirements of the proposed promulgation of this order as 10 CFR Part 834. The document was developed following the step-by-step process described in the Draft Handbook for Controlling Release for Reuse or Recycle Property Containing Residual Radioactive Material

  2. Preparation of uranium ingots from double fluorides

    International Nuclear Information System (INIS)

    Le Boulbin, E.

    1967-05-01

    A simple method has been developed for the preparation of uranium double fluorides and has given a new impetus to the study of the reduction of these compounds with a view to obtaining very pure uranium ingots. This reduction can be carried out using calcium or magnesium as the reducing agent, this latter metal being very interesting from the practical point of view. A comparative study of the heat balances of the reduction processes for the double fluorides and for uranium tetrafluoride has shown that reduction of the double fluorides is possible. The exact experimental conditions for these reductions have been determined. Our study has shown in particular that the reduction of the double salt UF 4 , CaF 2 by magnesium leads to the production of small (20 to 500 g) samples of high-purity uranium with a yield of 99 per cent. (author) [fr

  3. Method of forming buried oxide layers in silicon

    Science.gov (United States)

    Sadana, Devendra Kumar; Holland, Orin Wayne

    2000-01-01

    A process for forming Silicon-On-Insulator is described incorporating the steps of ion implantation of oxygen into a silicon substrate at elevated temperature, ion implanting oxygen at a temperature below 200.degree. C. at a lower dose to form an amorphous silicon layer, and annealing steps to form a mixture of defective single crystal silicon and polycrystalline silicon or polycrystalline silicon alone and then silicon oxide from the amorphous silicon layer to form a continuous silicon oxide layer below the surface of the silicon substrate to provide an isolated superficial layer of silicon. The invention overcomes the problem of buried isolated islands of silicon oxide forming a discontinuous buried oxide layer.

  4. Modelling of Damage During Hot Forging of Ingots

    DEFF Research Database (Denmark)

    Christiansen, Peter; Hattel, Jesper Henri; Bay, Niels

    2013-01-01

    Ductile damage modelling in the ingot forging process is discussed. Advantages and disadvantages of both coupled and uncoupled ductile damage models are presented. Some uncoupled damage models are examined in greater detail regarding their applicability to different processes, where hydrostatic...

  5. Numerical modelling of damage evolution in ingot forging

    DEFF Research Database (Denmark)

    Christiansen, Peter; Martins, Paulo A.F.; Bay, Niels Oluf

    2015-01-01

    The ingot forging process is numerically simulated applying both the Shima-Oyane porous plasticity model as a coupled damage model and the uncoupled normalized Cockcroft & Latham criterion. Four different cases including two different lower die angles (120º and 180º) and two different sizes of feed...... (400mm and 800mm) are analysed. Comparison of the simulation results with recommendations in literature on ingot forging, indicates the normalized Cockcroft & Latham damage criterion to be the most realistic of the two....

  6. Structural Transformations Versus Hard Particles Motion in the Brass Ingots

    Directory of Open Access Journals (Sweden)

    Wołczyński W.

    2017-12-01

    Full Text Available A mathematical method for the forecast of the type of structure in the steel static ingot has been recently developed. Currently, the method has been applied to structural zones prediction in the brass ingots obtained by the continuous casting. Both the temperature field and thermal gradient field have been calculated in order to predict mathematically the existence of some structural zones in the solidifying brass ingot. Particularly, the velocity of the liquidus isotherm movement and thermal gradient behavior versus solidification time have been considered. The analysis of the mentioned velocity allows the conclusion that the brass ingots can evince: chilled columnar grains-, (CC, fine columnar grains-, (FC, columnar grains-, (C, equiaxed grains zone, (E, and even the single crystal, (SC, situated axially. The role of the mentioned morphologies is analyzed to decide whether the hard particles existing in the brass ingots can be swallowed or rejected by the solid / liquid (s/l interface of a given type of the growing grains. It is suggested that the columnar grains push the hard particles to the end of a brass ingot during its continuous casting.

  7. Photoluminescence of polycrystalline CuIn 0.5 Ga 0.5 Te 2 thin films grown by flash evaporation

    KAUST Repository

    Yandjah, L.; Bechiri, L.; Benabdeslem, M.; Benslim, N.; Amara, A.; Portier, X.; Bououdina, M.; Ziani, Ahmed

    2018-01-01

    Polycrystalline CuIn0.5Ga0.5Te2 films were deposited by flash evaporation from ingot prepared by reacting, in stoichiometric proportions, high purity Cu, In, Ga and Te elements in vacuum sealed quartz . The as-obtained films were characterized by X

  8. Continuous Czochralski growth: Silicon sheet growth development of the large area sheet task of the low cost silicon solar array project

    Science.gov (United States)

    Johnson, C. M.

    1980-12-01

    The growth of 100 kg of silicon single crystal material, ten cm in diameter or greater, and 150 kg of silicon single crystal material 15 cm or greater utilizing one common silicon container material (one crucible) is investigated. A crystal grower that is recharged with a new supply of polysilicon material while still under vacuum and at temperatures above the melting point of silicon is developed. It accepts large polysilicon charges up to 30 kg, grows large crystal ingots (to 15 cm diameter and 25 kg in weight), and holds polysilicon material for recharging (rod or lump) while, at the same time, growing crystal ingots. Special equipment is designed to recharge polysilicon rods, recharge polysilicon lumps, and handle and store large, hot silicon crystal ingots. Many continuous crystal growth runs were performed lasting as long as 109 hours and producing as many as ten crystal ingots, 15 cm with weights progressing to 27 kg.

  9. Process design and simulation for optimizing the oxygen concentration in Czochralski-grown single-crystal silicon

    International Nuclear Information System (INIS)

    Jung, Y. J.; Kim, W. K.; Jung, J. H.

    2014-01-01

    The highest-concentration impurity in a single-crystal silicon ingot is oxygen, which infiltrates the ingot during growth stage. This oxygen adversely affects the wafer is quality. This study was aimed at finding an optimal design for the Czochralski (Cz) process to enable high-quality and low cost (by reducing power consumption) wafer production by controlling the oxygen concentration in the silicon ingots. In the Cz process, the characteristics of silicon ingots during crystallization are greatly influenced by the design and the configuration of the hot zone, and by crystallization rate. In order to identify process conditions for obtaining an optimal oxygen concentration of 11 - 13 ppma (required for industrial-grade ingots), designed two shield shapes for the hot zone. Furthermore, oxygen concentrations corresponding to these two shapes were compared by evaluating each shape at five different production speeds. In addition, simulations were performed to identify the optimal shield design for industrial applications.

  10. Process design and simulation for optimizing the oxygen concentration in Czochralski-grown single-crystal silicon

    Energy Technology Data Exchange (ETDEWEB)

    Jung, Y. J.; Kim, W. K.; Jung, J. H. [Yeungnam University, Gyeongsan (Korea, Republic of)

    2014-08-15

    The highest-concentration impurity in a single-crystal silicon ingot is oxygen, which infiltrates the ingot during growth stage. This oxygen adversely affects the wafer is quality. This study was aimed at finding an optimal design for the Czochralski (Cz) process to enable high-quality and low cost (by reducing power consumption) wafer production by controlling the oxygen concentration in the silicon ingots. In the Cz process, the characteristics of silicon ingots during crystallization are greatly influenced by the design and the configuration of the hot zone, and by crystallization rate. In order to identify process conditions for obtaining an optimal oxygen concentration of 11 - 13 ppma (required for industrial-grade ingots), designed two shield shapes for the hot zone. Furthermore, oxygen concentrations corresponding to these two shapes were compared by evaluating each shape at five different production speeds. In addition, simulations were performed to identify the optimal shield design for industrial applications.

  11. Study on Fabrication of Ni-5 at.%W Tapes for Coated Conductors from Cylinder Ingots

    DEFF Research Database (Denmark)

    Ma, L.; Suo, H. L.; Yue, Zhao

    2015-01-01

    Ni-5 at.%W (Ni5W) tapes with a strong cube texture were fabricated using the RABiTS technique and by starting from cylindrical shaped ingots. In contrast to a conventional cuboid-shaped ingot, a cylinder shaped ingot has no anisotropy along the axial direction and the resulting tape will therefore...

  12. Effect of impurities and processing on silicon solar cells. Volume 1: Characterization methods for impurities in silicon and impurity effects data base

    Science.gov (United States)

    Hopkins, R. H.; Davis, J. R.; Rohatgi, A.; Campbell, R. B.; Blais, P. D.; Rai-Choudhury, P.; Stapleton, R. E.; Mollenkopf, H. C.; Mccormick, J. R.

    1980-01-01

    Two major topics are treated: methods to measure and evaluate impurity effects in silicon and comprehensive tabulations of data derived during the study. Discussions of deep level spectroscopy, detailed dark I-V measurements, recombination lifetime determination, scanned laser photo-response, conventional solar cell I-V techniques, and descriptions of silicon chemical analysis are presented and discussed. The tabulated data include lists of impurity segregation coefficients, ingot impurity analyses and estimated concentrations, typical deep level impurity spectra, photoconductive and open circuit decay lifetimes for individual metal-doped ingots, and a complete tabulation of the cell I-V characteristics of nearly 200 ingots.

  13. Multi-objective optimization of die geometry in ingot forging

    DEFF Research Database (Denmark)

    Christiansen, Peter; Martins, Paulo A.F.; Bay, Niels

    2014-01-01

    The soundness of an ingot after hot forging with different V-shaped lower dies is evaluated using finite element simulations.Two different modelling approaches that make use of uncoupled ductile damage and coupled ductile damage based on porousplasticity are employed. It is shown that the two...

  14. Application of directional solidification ingot (LSD) in forging of PWR reactor vessel heads

    International Nuclear Information System (INIS)

    Benhamou, C.; Poitrault, I.

    1985-09-01

    Creusot-Loire Industrie uses this type of ingot for manufacture of Framatome 1300 and 1450 MW 4-loop PWR reactor vessel heads. This type of ingot offers a number advantages: improved internal soundness; greater chemical, structural and mechanical homogeneity of the finished part; simplified forging process. After a brief description of the pouring and solidification processes, this paper presents an analysis of the results of examinations performed on the prototype forging, as well as review of results obtained during industrial fabrication of dished heads from LSD ingots. The advantages of the LSD ingot over conventional ingots are discussed in conclusion

  15. Kinetics of steel heavy ingot formation in dies of semicontinuous-casting machines

    International Nuclear Information System (INIS)

    Tsukerman, V.Ya.; Marchenko, I.K.

    1986-01-01

    Formation kinetics of round section ingot of up to 0.67 m in diameter was analyzed in dies of semicontinuous-casting machines on casting of the most usable assortment steels: medium-carbon low-alloyed and chromium-nickel stainless steels. It is established that solidification coefficient decreases in direct proportion to ingot diameter. Value of different-thickness ingot skin at die outlet is in direct proportion to a casted steel overheating temperature, ingot diameter and inversely proportional to the number and diameter of holes in a ladder nozzle and square root of ingot drawing rate

  16. Silicon heterojunction transistor

    International Nuclear Information System (INIS)

    Matsushita, T.; Oh-uchi, N.; Hayashi, H.; Yamoto, H.

    1979-01-01

    SIPOS (Semi-insulating polycrystalline silicon) which is used as a surface passivation layer for highly reliable silicon devices constitutes a good heterojunction for silicon. P- or B-doped SIPOS has been used as the emitter material of a heterojunction transistor with the base and collector of silicon. An npn SIPOS-Si heterojunction transistor showing 50 times the current gain of an npn silicon homojunction transistor has been realized by high-temperature treatments in nitrogen and low-temperature annealing in hydrogen or forming gas

  17. Production of High Quality Die Steels from Large ESR Slab Ingots

    Science.gov (United States)

    Geng, Xin; Jiang, Zhou-hua; Li, Hua-bing; Liu, Fu-bin; Li, Xing

    With the rapid development of manufacture industry in China, die steels are in great need of large slab ingot of high quality and large tonnage, such as P20, WSM718R and so on. Solidification structure and size of large slab ingots produced with conventional methods are not satisfied. However, large slab ingots manufactured by ESR process have a good solidification structure and enough section size. In the present research, the new slab ESR process was used to produce the die steels large slab ingots with the maximum size of 980×2000×3200mm. The compact and sound ingot can be manufactured by the slab ESR process. The ultra-heavy plates with the maximum thickness of 410 mm can be obtained after rolling the 49 tons ingots. Due to reducing the cogging and forging process, the ESR for large slab ingots process can increase greatly the yield and production efficiency, and evidently cut off product costs.

  18. The status of silicon ribbon growth technology for high-efficiency silicon solar cells

    Science.gov (United States)

    Ciszek, T. F.

    1985-01-01

    More than a dozen methods have been applied to the growth of silicon ribbons, beginning as early as 1963. The ribbon geometry has been particularly intriguing for photovoltaic applications, because it might provide large area, damage free, nearly continuous substrates without the material loss or cost of ingot wafering. In general, the efficiency of silicon ribbon solar cells has been lower than that of ingot cells. The status of some ribbon growth techniques that have achieved laboratory efficiencies greater than 13.5% are reviewed, i.e., edge-defined, film-fed growth (EFG), edge-supported pulling (ESP), ribbon against a drop (RAD), and dendritic web growth (web).

  19. Nanopores creation in boron and nitrogen doped polycrystalline graphene: A molecular dynamics study

    Science.gov (United States)

    Izadifar, Mohammadreza; Abadi, Rouzbeh; Nezhad Shirazi, Ali Hossein; Alajlan, Naif; Rabczuk, Timon

    2018-05-01

    In the present paper, molecular dynamic simulations have been conducted to investigate the nanopores creation on 10% of boron and nitrogen doped polycrystalline graphene by silicon and diamond nanoclusters. Two types of nanoclusters based on silicon and diamond are used to investigate their effect for the fabrication of nanopores. Therefore, three different diameter sizes of the clusters with five kinetic energies of 10, 50, 100, 300 and 500 eV/atom at four different locations in boron or nitrogen doped polycrystalline graphene nanosheets have been perused. We also study the effect of 3% and 6% of boron doped polycrystalline graphene with the best outcome from 10% of doping. Our results reveal that the diamond cluster with diameter of 2 and 2.5 nm fabricates the largest nanopore areas on boron and nitrogen doped polycrystalline graphene, respectively. Furthermore, the kinetic energies of 10 and 50 eV/atom can not fabricate nanopores in some cases for silicon and diamond clusters on boron doped polycrystalline graphene nanosheets. On the other hand, silicon and diamond clusters fabricate nanopores for all locations and all tested energies on nitrogen doped polycrystalline graphene. The area sizes of nanopores fabricated by silicon and diamond clusters with diameter of 2 and 2.5 nm are close to the actual area size of the related clusters for the kinetic energy of 300 eV/atom in all locations on boron doped polycrystalline graphene. The maximum area and the average maximum area of nanopores are fabricated by the kinetic energy of 500 eV/atom inside the grain boundary at the center of the nanosheet and in the corner of nanosheet with diameters of 2 and 3 nm for silicon and diamond clusters on boron and nitrogen doped polycrystalline graphene.

  20. Solidification Mapping of a Nickel Alloy 718 Laboratory VAR Ingot

    Science.gov (United States)

    Watt, Trevor J.; Taleff, Eric M.; Lopez, Felipe; Beaman, Joe; Williamson, Rodney

    The solidification microstructure of a laboratory-scale Nickel alloy 718 vacuum arc remelted (VAR) ingot was analyzed. The cylindrical, 210-mm-diameter ingot was sectioned along a plane bisecting it length-wise, and this mid-plane surface was ground and etched using Canada's reagent to reveal segregation contrast. Over 350 photographs were taken of the etched mid-plane surface and stitched together to form a single mosaic image. Image data in the resulting mosaic were processed using a variety of algorithms to extract quantities such as primary dendrite orientation, primary dendrite arm spacing (PDAS), and secondary dendrite arm spacing (SDAS) as a function of location. These quantities were used to calculate pool shape and solidification rate during solidification using existing empirical relationships for Nickel Alloy 718. The details and outcomes of this approach, along with the resulting comparison to experimental processing conditions and computational models, are presented.

  1. FY 1977 Annual report on Sunshine Project results. Research and development of photovoltaic power generation systems (Research and development of particle nonacceleration growth type silicon thin-film crystals); 1977 nendo taiyoko hatsuden system no kenkyu kaihatsu seika hokokusho. Ryushi hikasoku seichogata silicon usumaku kessho no kenkyu kaihatsu

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    1978-03-01

    As part of the research and development project for producing photovoltaic power generation systems at reduced cost, the R and D efforts are made for producing particle nonacceleration growth type silicon thin-film crystals. The research items are (1) research on thin-film crystals, and (2) research on cell-structuring method. The item (1) studies quantities, types and electrical properties of impurities and crystal defects in the polycrystalline ingots, produced by the Czochralski method from metal grade silicon and purified metal grade silicon stocks. Next, the substrate prepared above is coated with a thin film of silicon by the vapor-phase growth method with dichlorosilane as the source, to evaluate the thin-film crystals by measuring the crystal defects and lifetime of small numbers of carriers. The item (2) studies the effects of the solder dipping method. In addition, unevenness of photoelectric current is analyzed by a laser scanning microscope, to investigate the effects of the secondary impurities and crystal defects in the substrate crystals on photoelectric current. As a result, it is found that conversion efficiency is improved by grading the hole concentration in the p-type activated layer. The targets of 10 to 20 m{sup 2} as the area and 7 to 8% as the conversion efficiency are attained by preparing the crystals again. (NEDO)

  2. Numerical Model for Solidification Zones Selection in the Large Ingots

    Directory of Open Access Journals (Sweden)

    Wołczyński W.

    2015-12-01

    Full Text Available A vertical cut at the mid-depth of the 15-ton forging steel ingot has been performed by curtesy of the CELSA - Huta Ostrowiec plant. Some metallographic studies were able to reveal not only the chilled undersized grains under the ingot surface but columnar grains and large equiaxed grains as well. Additionally, the structural zone within which the competition between columnar and equiaxed structure formation was confirmed by metallography study, was also revealed. Therefore, it seemed justified to reproduce some of the observed structural zones by means of numerical calculation of the temperature field. The formation of the chilled grains zone is the result of unconstrained rapid solidification and was not subject of simulation. Contrary to the equiaxed structure formation, the columnar structure or columnar branched structure formation occurs under steep thermal gradient. Thus, the performed simulation is able to separate both discussed structural zones and indicate their localization along the ingot radius as well as their appearance in term of solidification time.

  3. Anelasticity of polycrystalline indium

    Energy Technology Data Exchange (ETDEWEB)

    Sapozhnikov, K., E-mail: k.sapozhnikov@mail.ioffe.ru [A.F.Ioffe Physical-Technical Institute, Politekhnicheskaya 26, 194021 St. Petersburg (Russian Federation); Golyandin, S. [A.F.Ioffe Physical-Technical Institute, Politekhnicheskaya 26, 194021 St. Petersburg (Russian Federation); Kustov, S. [Dept. de Fisica, Universitat de les Illes Balears, Cra Valldemossa km 7.5, E 07122 Palma de Mallorca (Spain)

    2009-09-15

    Mechanisms of anelasticity of polycrystalline indium have been studied over wide ranges of temperature (7-320 K) and strain amplitude (2 x 10{sup -7}-3.5 x 10{sup -4}). Measurements of the internal friction and Young's modulus have been performed by means of the piezoelectric resonant composite oscillator technique using longitudinal oscillations at frequencies of about 100 kHz. The stages of the strain amplitude dependence of the internal friction and Young's modulus defect, which can be attributed to dislocation - point defect and dislocation - dislocation interactions, have been revealed. It has been shown that thermal cycling gives rise to microplastic straining of polycrystalline indium due to the anisotropy of thermal expansion and to appearance of a 'recrystallization' internal friction maximum in the temperature spectra of amplitude-dependent anelasticity. The temperature range characterized by formation of Cottrell's atmospheres of point defects around dislocations has been determined from the acoustic data.

  4. Characterization of electrical and optical properties of silicon based materials

    Energy Technology Data Exchange (ETDEWEB)

    Jia, Guobin

    2009-12-04

    In this work, the electrical and luminescence properties of a series of silicon based materials used for photovoltaics, microelectronics and nanoelectronics have been investigated by means of electron beam induced current (EBIC), cathodoluminescence (CL), photoluminescence (PL) and electroluminescence (EL) methods. Photovoltaic materials produced by block casting have been investigated by EBIC on wafers sliced from different parts of the ingot. Various solar cell processings have been compared in parallel wafers by means of EBIC collection efficiency measurements and contrast-temperature C(T) behaviors of the extended defects, i. e. dislocations and grain boundaries (GBs). It was found that the solar cell processing with phosphorus diffusion gettering (PDG) followed with a SiN firing greatly reduces the recombination activity of extended defects at room temperature, and improves the bulk property simultaneously. A remaining activity of the dislocations indicates the limitation of the PDG at extended defects. Abnormal behavior of the dislocation activity after certain solar cell processes was also observed in the region with high dislocation density, the dislocations are activated after certain solar cell processings. In order to evaluate the properties of a thin polycrystalline silicon layer prepared by Al-induced layer exchange (Alile) technique, epitaxially layer grown on silicon substrate with different orientations was used as a model system to investigate the impact by the process temperature and the substrates. EBIC energy dependent collection efficiency measurements reveal an improvement of the epilayer quality with increasing substrate temperature during the growth from 450 C to 650 C, and a decrease of epilayer quality at 700 C. PL measurements on the epitaxially grown Si layer on silicon substrates revealed no characteristic dislocation-related luminescence (DRL) lines at room temperature and 77 K, while in the samples prepared by Alile process, intense

  5. Radiation resistant passivation of silicon solar cells

    International Nuclear Information System (INIS)

    Swanson, R.M.; Gan, J.Y.; Gruenbaum, P.E.

    1991-01-01

    This patent describes a silicon solar cell having improved stability when exposed to concentrated solar radiation. It comprises a body of silicon material having a major surface for receiving radiation, a plurality of p and n conductivity regions in the body for collecting electrons and holes created by impinging radiation, and a passivation layer on the major surface including a first layer of silicon oxide in contact with the body and a polycrystalline silicon layer on the first layer of silicon oxide

  6. Fiscal 1998 New Sunshine Program achievement report. Development for practical application of photovoltaic system - Development of thin-film solar cell manufacturing technology (Development of low-cost large-area module manufacturing technology - Development of application type novel-structure thin-film solar cell manufacturing technology - Development of amorphous silicon/thin-film polycrystalline silicon hybrid thin-film solar cell manufacturing technology); 1998 nendo taiyoko hatsuden system jitsuyoka gijutsu kaihatsu seika hokokusho. Usumaku taiyo denchi no seizo gijutsu kaihatsu / tei cost daimenseki module seizo gijutsu kaihatsu (oyogata shinkozo usumaku taiyo denchi no seizo gijutsu kaihatsu / amorphous silicon/usumaku takessho silicon hybrid usumaku taiyo denchi no seizo gijutsu kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    1999-03-01

    The project aims to manufacture the above for the development of low-cost high-efficiency practical cells. Technologies were developed to homogeneously fabricate films with an average efficiency of 10% or more in a 100mm times 85mm area in a STAR (naturally surface texture and enhanced absorption with a back reflector) structure thin-film polycrystalline silicon (poly-Si) solar cell. The texture shape was improved for a higher light trapping effect and a STAR structure cell highly sensitive to long wavelengths and fit for use for a hybrid cell bottom layer was obtained. Various cells were examined for temperature characteristics, and it was found that thin-film poly-Si cells present a temperature coefficient equal to or less than that of bulk single-crystal silicon systems, and hybrid cells a temperature coefficient similar to that of a-Si systems. The technology was applied to a hybrid solar cell in which an a-Si cell was placed on STAR structure thin film poly-Si cells, and a resultant 3-layer a-Si/poly-Si/poly-Si cell exhibited a stabilization factor of 12.0% after 550 hours of optical irradiation. (NEDO)

  7. Formation of photovoltaic modules based on polycrystalline solar cells

    OpenAIRE

    L. A. Dobrzański; A. Drygała; A. Januszka

    2009-01-01

    Purpose: The main aim of the paper is formation of photovoltaic modules and analysis of their main electric parameters.Design/methodology/approach: Photovoltaic modules were produced from four polycrystalline silicon solar cells, that were cut and next joined in series. Soft soldering technique and copper-tin strip were used for joining cells.Findings: In order to provide useful power for any application, the individual solar cells must be connected together to give the appropriate current an...

  8. Production of a 304 stainless steel nuclear reactor forging from a very large electroslag refined ingot

    International Nuclear Information System (INIS)

    Watkins, E.J.; Tihansky, E.L.

    1986-01-01

    A four-loop, upper barrel flange forging for a nuclear reactor was produced from what the authors believe to be the largest 304H grade stainless steel electroslag refined (ESR) ingot ever refined. The ingot was refined in a 1524-mm-diameter, ingot withdrawal-type ESR furnace using a lime-bearing slag, low-frequency a-c power, and dry air protection. Five electrodes were remelted in order to produce the desired ingot weight. The ingot was subsequently forged in a five-step operation on a 6800-metric-ton press to produce the desired barrel flange configuration. Testing of the finished machined forging revealed excellent tensile ductility, excellent ultrasonic penetrability, and good chemical uniformity with no macrosegregation. Overall quality was judged to be superior to previously produced, conventionally melted forgings

  9. Numerical simulation of convection and inclusion distribution during solidification in a heavy steel ingot

    International Nuclear Information System (INIS)

    Lin, Rui; Shen, Houfa

    2015-01-01

    Inclusions content in the steel ingot is an important index for homogeneity, and it becomes more serious for heavy steel ingots which are used for major equipment. However, knowledge about the formation of inclusion in steel ingot is limited, and modeling of inclusion distribution is still challenging, so it is of great significance to research the behavior of inclusion. In this paper, fluid flow during solidification is numerically simulated based on the equilibrium equations of mass, momentum and energy, and then inclusion distribution is modeled according to the Lagrangian Stokes trajectory method. The Results show that the inclusion distribution in the steel ingot is influenced by the flow pattern which is affected by the solidification pattern. Therefore, inclusion distribution could be controlled by the solidification front with the optimization of heat transfer condition such as the hot top design of steel ingot for the high quality steel production. (paper)

  10. Numerical analysis on effect of annealing mc-Si ingot grown by DS process for PV application

    Science.gov (United States)

    Aravindan, G.; Srinivasan, M.; Aravinth, K.; Ramasamy, P.

    2017-10-01

    Silicon solar cells play a crucial role in Photo voltaic (PV) application. We have numerically investigated thermal stress and normal stress components (Sigma 11, Sigma 22, Sigma 33 and sigma 12) by using finite volume method. The maximum thermal stress has low value at the centre region for 900 K and 700 K annealing temperatures comparing all the cases. The maximum thermal stress at peripheral region is low for 700 K annealing compared to 900 K annealing. The annealing effect of mc-Si ingot normal stress components is discussed. At 700 K annealing temperature the normal stress in 11 and 33 direction has lower maximum and at the 900 K annealing temperature the normal stress in 22 and 12 direction has lower maximum.

  11. Porous silicon gettering

    Energy Technology Data Exchange (ETDEWEB)

    Tsuo, Y.S.; Menna, P.; Pitts, J.R. [National Renewable Energy Lab., Golden, CO (United States)] [and others

    1996-05-01

    The authors have studied a novel extrinsic gettering method that uses the large surface areas produced by a porous-silicon etch as gettering sites. The annealing step of the gettering used a high-flux solar furnace. They found that a high density of photons during annealing enhanced the impurity diffusion to the gettering sites. The authors used metallurgical-grade Si (MG-Si) prepared by directional solidification casing as the starting material. They propose to use porous-silicon-gettered MG-Si as a low-cost epitaxial substrate for polycrystalline silicon thin-film growth.

  12. Gelcasting polycrystalline alumina

    Energy Technology Data Exchange (ETDEWEB)

    Janney, M.A. [Oak Ridge National Lab., TN (United States)

    1997-04-01

    This work is being done as part of a CRADA with Osram-Sylvania, Inc. (OSI) OSI is a major U.S. manufacturer of high-intensity lighting. Among its products is the Lumalux{reg_sign} line of high-pressure sodium vapor arc lamps, which are used for industrial, highway, and street lighting. The key to the performance of these lamps is the polycrystalline alumina (PCA) tube that is used to contain the plasma that is formed in the electric arc. That plasma consists of ionized sodium, mercury, and xenon vapors. The key attributes of the PCA tubes are their transparency (95% total transmittance in the visible region), their refractoriness (inner wall temperature can reach 1400{degrees}C), and their chemical resistance (sodium and mercury vapor are extremely corrosive). The current efficiency of the lamps is very high, on the order of several hundred lumens / watt. (Compare - incandescent lamps -13 lumens/watt fluorescent lamps -30 lumens/watt.) Osram-Sylvania would like to explore using gelcasting to form PCA tubes for Lumalux{reg_sign} lamps, and eventually for metal halide lamps (known as quartz-halogen lamps). Osram-Sylvania, Inc. currently manufactures PCA tubes by isostatic pressing. This process works well for the shapes that they presently use. However, there are several types of tubes that are either difficult or impossible to make by isostatic pressing. It is the desire to make these new shapes and sizes of tubes that has prompted Osram-Sylvania`s interest in gelcasting. The purpose of the CRADA is to determine the feasibility of making PCA items having sufficient optical quality that they are useful in lighting applications using gelcasting.

  13. Development and basic photovoltaic characteristics of a solar generator with double-sided silicon cells

    International Nuclear Information System (INIS)

    Aliev, R.; Mansurov, Kh.

    2015-01-01

    A new solar generator consisting of double-sided silicon sensing elements is described. The basic photovoltaic parameters of solar generators are made of mono- and polycrystalline silicon solar cells. (author)

  14. Silicon germanium mask for deep silicon etching

    KAUST Repository

    Serry, Mohamed

    2014-07-29

    Polycrystalline silicon germanium (SiGe) can offer excellent etch selectivity to silicon during cryogenic deep reactive ion etching in an SF.sub.6/O.sub.2 plasma. Etch selectivity of over 800:1 (Si:SiGe) may be achieved at etch temperatures from -80 degrees Celsius to -140 degrees Celsius. High aspect ratio structures with high resolution may be patterned into Si substrates using SiGe as a hard mask layer for construction of microelectromechanical systems (MEMS) devices and semiconductor devices.

  15. Silicon germanium mask for deep silicon etching

    KAUST Repository

    Serry, Mohamed; Rubin, Andrew; Refaat, Mohamed; Sedky, Sherif; Abdo, Mohammad

    2014-01-01

    Polycrystalline silicon germanium (SiGe) can offer excellent etch selectivity to silicon during cryogenic deep reactive ion etching in an SF.sub.6/O.sub.2 plasma. Etch selectivity of over 800:1 (Si:SiGe) may be achieved at etch temperatures from -80 degrees Celsius to -140 degrees Celsius. High aspect ratio structures with high resolution may be patterned into Si substrates using SiGe as a hard mask layer for construction of microelectromechanical systems (MEMS) devices and semiconductor devices.

  16. Microstructures and constituents of super-high strength aluminum alloy ingots made through LFEC process

    Directory of Open Access Journals (Sweden)

    WANG Shuang

    2007-11-01

    Full Text Available Ingots of a new super-high strength Al-Zn-Mg-Cu-Zr alloy were produced respectively by low frequency electromagnetic casting (LFEC and by conventional direct chill (DC casting process. Microstructure and constituents of the ingots were studied. The results indicated that the LFEC process significantly refines microstructure and constituents of the alloy, and to some extent, decreases the area (or volume fraction of constituents and eutectic structure precipitated at grain boundaries. But, no difference in the type of constituents was observed between LFEC and DC ingots. The results also showed LFEC process can improve the as-cast mechanical properties.

  17. Investigation of the crystallization process of titanium alloy ingots produced by vacuum arc melting method

    International Nuclear Information System (INIS)

    Tetyukhin, V.V.; Kurapov, V.N.; Trubin, A.N.; Demchenko, M.V.; Lazarev, V.G.; Ponedilko, S.V.; Dubrovina, N.T.; Kurapova, L.A.

    1978-01-01

    The process of crystallization and hardening of the VT3-1 and VT9 titanium alloys ingots during the vacuum-arc remelting (VAR) has been studied. In order to investigate the kinetics of the hole shape changing and the peculiarities of the ingot formation during the VAR, the radiography method has been used. It is established that the VAR of the titanium alloy ingots is basically a continuous process. An intense heating of the liquid bath mirror and the availability of high temperature gradients in the hole are the typical features of the VAR process

  18. Memory characteristics of silicon nitride with silicon nanocrystals as a charge trapping layer of nonvolatile memory devices

    International Nuclear Information System (INIS)

    Choi, Sangmoo; Yang, Hyundeok; Chang, Man; Baek, Sungkweon; Hwang, Hyunsang; Jeon, Sanghun; Kim, Juhyung; Kim, Chungwoo

    2005-01-01

    Silicon nitride with silicon nanocrystals formed by low-energy silicon plasma immersion ion implantation has been investigated as a charge trapping layer of a polycrystalline silicon-oxide-nitride-oxide-silicon-type nonvolatile memory device. Compared with the control sample without silicon nanocrystals, silicon nitride with silicon nanocrystals provides excellent memory characteristics, such as larger width of capacitance-voltage hysteresis, higher program/erase speed, and lower charge loss rate at elevated temperature. These improved memory characteristics are derived by incorporation of silicon nanocrystals into the charge trapping layer as additional accessible charge traps with a deeper effective trap energy level

  19. Process Characterization of Electrical Discharge Machining of Highly Doped Silicon

    Science.gov (United States)

    2012-06-01

    of mechanism is shown in Figure 2 showing the wire feed panel where the spool of 5 (DiBitonto, et...Uno High efficiency boring of monocrystalline silicon ingot by EDM RAM Si (P-type) conductivity 0.01 ohm-cm 1mm Cu pipe electrode, rotating at

  20. The adhesion and tribology analysis of polycrystalline diamond coated on Si3N4 substrate

    International Nuclear Information System (INIS)

    Hamzah, E.; Purniawan, A.

    2007-01-01

    Cauliflower and octahedral structure of polycrystalline diamond was deposited on silicon nitride (Si 3 N 4 ) substrate by microwave plasma assisted chemical vapor deposition (MPACVD). In our earlier work, the effects of deposition parameters namely, % Methane (CH 4 ) diluted in hydrogen (H 2 ), microwave power and chamber pressure on surface morphology were studied. In the present work the polycrystalline diamond coating adhesion and tribology behaviour were investigated. Rockwell C hardness tester and pin-on-disk tribometer were used to determine the adhesion and tribology properties on diamond coating, respectively. The morphology of the diamond before and after indentation was observed using field emission scanning electron microscopy (FESEM). Based on the adhesion analysis results, it was found that octahedral morphology has better adhesion than cauliflower structure. It was indicated by few cracks and less peel-off than cauliflower structure of polycrystalline diamond after indentation. Based on tribology analysis, polycrystalline diamond coated on substrate has better tribology properties than uncoated substrate. (author)

  1. Prediction of qualitative parameters of slab steel ingot using numerical modelling

    Directory of Open Access Journals (Sweden)

    M. Tkadlečková

    2016-07-01

    Full Text Available The paper describes the verification of casting and solidification of heavy slab ingot weighing 40 t from tool steel by means of numerical modelling with use of a finite element method. The pre-processing, processing and post-processing phases of numerical modelling are outlined. Also, the problems with determination of the thermodynamic properties of materials and with determination of the heat transfer between the individual parts of the casting system are discussed. The final porosity, macrosegregation and the risk of cracks were predicted. The results allowed us to use the slab ingot instead of the conventional heavy steel ingot and to improve the ratio, the chamfer and the external shape of the wall of the new design of the slab ingot.

  2. Summary of performance of superconducting radio-frequency cavities built from CBMM niobium ingots

    International Nuclear Information System (INIS)

    Ciovati, Gianluigi; Dhakal, Pashupati; Kneisel, Peter; Myneni, Ganapati R.

    2015-01-01

    Several Nb ingots have been provided by CBMM to Jefferson Lab since 2004 as part of an R&D collaboration aimed at evaluating the performance of superconducting radio-frequency cavities built from ingots with different purity, as a results of different ingot production processes. Approximately 32 multi- and single-cell cavities with resonant frequency between ∼1.3-2.3 GHz were built, treated and tested at 2 K at Jefferson Lab between 2004 and 2014. The average peak surface field achieved in cavities made of RRR∼260 and RRR∼100-150 ingots was (119 ± 4) mT and (100 ± 8) mT, respectively. Higher quality factor values at 2.0 K have been measured in medium-purity, compared to higher purity material

  3. Summary of performance of superconducting radio-frequency cavities built from CBMM niobium ingots

    Science.gov (United States)

    Ciovati, Gianluigi; Dhakal, Pashupati; Kneisel, Peter; Myneni, Ganapati R.

    2015-12-01

    Several Nb ingots have been provided by CBMM to Jefferson Lab since 2004 as part of an R&D collaboration aimed at evaluating the performance of superconducting radio-frequency cavities built from ingots with different purity, as a results of different ingot production processes. Approximately 32 multi- and single-cell cavities with resonant frequency between ˜1.3-2.3 GHz were built, treated and tested at 2 K at Jefferson Lab between 2004 and 2014. The average peak surface field achieved in cavities made of RRR˜260 and RRR˜100-150 ingots was (119 ± 4) mT and (100 ± 8) mT, respectively. Higher quality factor values at 2.0 K have been measured in medium-purity, compared to higher purity material.

  4. Polycrystalline Diamond Schottky Diodes and Their Applications.

    Science.gov (United States)

    Zhao, Ganming

    In this work, four-hot-filament CVD techniques for in situ boron doped diamond synthesis on silicon substrates were extensively studied. A novel tungsten filament shape and arrangement used to obtain large-area, uniform, boron doped polycrystalline diamond thin films. Both the experimental results and radiative heat transfer analysis showed that this technique improved the uniformity of the substrate temperature. XRD, Raman and SEM studies indicate that large area, uniform, high quality polycrystalline diamond films were obtained. Schottky diodes were fabricated by either sputter deposition of silver or thermal evaporation of aluminum or gold, on boron doped diamond thin films. High forward current density and a high forward-to-reverse current ratio were exhibited by silver on diamond Schottky diodes. Schottky barrier heights and the majority carrier concentrations of both aluminum and gold contacted diodes were determined from the C-V measurements. Furthermore, a novel theoretical C-V-f analysis of deep level boron doped diamond Schottky diodes was performed. The analytical results agree well with the experimental results. Compressive stress was found to have a large effect on the forward biased I-V characteristics of the diamond Schottky diodes, whereas the effect on the reverse biased characteristics was relatively small. The stress effect on the forward biased diamond Schottky diode was attributed to piezojunction and piezoresistance effects. The measured force sensitivity of the diode was as high as 0.75 V/N at 1 mA forward bias. This result shows that CVD diamond device has potential for mechanical transducer applications. The quantitative photoresponse characteristics of the diodes were studied in the spectral range of 300 -1050 nm. Semi-transparent gold contacts were used for better photoresponse. Quantum efficiency as high as 50% was obtained at 500 nm, when a reverse bias of over 1 volt was applied. The Schottky barrier heights between either gold or

  5. High performance superconducting radio frequency ingot niobium technology for continuous wave applications

    International Nuclear Information System (INIS)

    Dhakal, Pashupati; Ciovati, Gianluigi; Myneni, Ganapati R.

    2015-01-01

    Future continuous wave (CW) accelerators require the superconducting radio frequency cavities with high quality factor and medium accelerating gradients (≤20 MV/m). Ingot niobium cavities with medium purity fulfill the specifications of both accelerating gradient and high quality factor with simple processing techniques and potential reduction in cost. This contribution reviews the current superconducting radiofrequency research and development and outlines the potential benefits of using ingot niobium technology for CW applications

  6. Formation of non-metallic inclusions and the possibility of their removal during ingot casting

    OpenAIRE

    Ragnarsson, Lars

    2010-01-01

    The present study was carried out to investigate the formation and evolution of non-metallic inclusions during ingot casting. Emphasize have been on understanding the types of inclusions formed and developed through the casting process and on the development of already existing inclusions carried over from the ladle during casting. Industrial experiments carried on at Uddeholm Tooling together with laboratory work and Computational Fluid Dynamics (CFD) simulations. Ingots of 5.8 tons have bee...

  7. Modelling of macrosegregation in steel ingots: benchmark validation and industrial application

    International Nuclear Information System (INIS)

    Li Wensheng; Shen Houfa; Liu Baicheng; Shen Bingzhen

    2012-01-01

    The paper presents the recent progress made by the authors on modelling of macrosegregation in steel ingots. A two-phase macrosegregation model was developed that incorporates descriptions of heat transfer, melt convection, solute transport, and solid movement on the process scale with microscopic relations for grain nucleation and growth. The formation of pipe shrinkage at the ingot top is also taken into account in the model. Firstly, a recently proposed numerical benchmark test of macrosegregation was used to verify the model. Then, the model was applied to predict the macrosegregation in a benchmark industrial-scale steel ingot. The predictions were validated against experimental data from the literature. Furthermore, macrosegregation experiment of an industrial 53-t steel ingot was performed. The simulation results were compared with the measurements. It is indicated that the typical macrosegregation patterns encountered in steel ingots, including a positively segregated zone in the hot top and a negative segregation in the bottom part of the ingot, are well reproduced with the model.

  8. Towards graphite-free hot zone for directional solidification of silicon

    Science.gov (United States)

    Dropka, Natasha; Buchovska, Iryna; Herrmann-Geppert, Iris; Klimm, Detlef; Kiessling, Frank M.; Degenhardt, Ulrich

    2018-06-01

    The reduction of SiC, Si3N4 and transition metals impurities in directionally solidified Si ingots poses one of the crucial challenges in the solar cells production. Particularly strong contamination comes from the graphite parts in the hot zone. Therefore, we selected three massive ceramic materials to replace graphite, developed the novel design of the crucible support and cover and compared the crystals grown in them with ingots from the standard graphite design. The experiments were performed for phosphorus n-doped silicon of G0 size. The ingots were compared with respect to O- and C-content, metal impurities, resistivity and lifetime. The superior performance of TiC relative to other ceramics was observed, particularly due to the lower concentration of substitutional carbon in Si ingot (up to 2.6 times) and the higher minority carrier lifetime of (up to 4.4 times) with narrow red zones.

  9. Achievement report for fiscal 1981 Sunshine Program on development of practical application technologies for photovoltaic power systems. Test production and verification of solar panels (Development of polycrystalline substrate process technologies); 1981 nendo taiyoko hatsuden system jitsuyoka gijutsu kaihatsu seika hokokusho. Taiyo denchi panel jikken seisaku kensho (takessho kiban kotei no gijutsu kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    1982-03-01

    Studies are conducted to enlarge the diameter of polycrystalline Si castings and to develop a low-loss slicing method using silicon nitride powder as mold releasing agent. The apparatus for Czochralski's pulling process is improved and tested using SEG (selective epitaxial growth) Si, and now the casting of a 150mm-diameter ingot is feasible. Also, test production of a 94mm-square wafer as specified by NEDO (New Energy and Industrial Technology Development Organization) is successfully carried out. Difficulties in separating the mold releasing agent from the crucible are solved by changing the Si{sub 3}N{sub 4} power solution from PVA (polyvinyl alcohol) to ethyl silicate. The design, manufacture, and installation of the important parts of the system for the mass production of castings are now complete. The crucible is designed to be movable relative to the heater section, and the molten Si is allowed to cool and solidify from the bottom upward. In relation with the development of low-cost wafer manufacturing technologies, low-loss slicing methods are studied. It is concluded that under the current circumstances a multi-blade saw is more promising than the multi-wire saw in view of the damaged slice rate, processing speed, operating cost, and maintainability. (NEDO)

  10. Polycrystalline thin films : A review

    Energy Technology Data Exchange (ETDEWEB)

    Valvoda, V [Charles Univ., Prague (Czech Republic). Faculty of Mathematics and Physics

    1996-09-01

    Polycrystalline thin films can be described in terms of grain morphology and in terms of their packing by the Thornton`s zone model as a function of temperature of deposition and as a function of energy of deposited atoms. Grain size and preferred grain orientation (texture) can be determined by X-ray diffraction (XRD) methods. A review of XRD analytical methods of texture analysis is given with main attention paid to simple empirical functions used for texture description and for structure analysis by joint texture refinement. To illustrate the methods of detailed structure analysis of thin polycrystalline films, examples of multilayers are used with the aim to show experiments and data evaluation to determine layer thickness, periodicity, interface roughness, lattice spacing, strain and the size of diffraction coherent volumes. The methods of low angle and high angle XRD are described and discussed with respect to their complementary information content.

  11. Diffraction by disordered polycrystalline fibers

    International Nuclear Information System (INIS)

    Stroud, W.J.; Millane, R.P.

    1995-01-01

    X-ray diffraction patterns from some polycrystalline fibers show that the constituent microcrystallites are disordered. The relationship between the crystal structure and the diffracted intensities is then quite complicated and depends on the precise kind and degree of disorder present. The effects of disorder on diffracted intensities must be included in structure determinations using diffraction data from such specimens. Theory and algorithms are developed here that allow the full diffraction pattern to be calculated for a disordered polycrystalline fiber made up of helical molecules. The model accommodates various kinds of disorder and includes the effects of finite crystallite size and cylindrical averaging of the diffracted intensities from a fiber. Simulations using these methods show how different kinds, or components, of disorder produce particular diffraction effects. General properties of disordered arrays of helical molecules and their effects on diffraction patterns are described. Implications for structure determination are discussed. (orig.)

  12. A continuous Czochralski silicon crystal growth system

    Science.gov (United States)

    Wang, C.; Zhang, H.; Wang, T. H.; Ciszek, T. F.

    2003-03-01

    Demand for large silicon wafers has driven the growth of silicon crystals from 200 to 300 mm in diameter. With the increasing silicon ingot sizes, melt volume has grown dramatically. Melt flow becomes more turbulent as melt height and volume increase. To suppress turbulent flow in a large silicon melt, a new Czochralski (CZ) growth furnace has been designed that has a shallow melt. In this new design, a crucible consists of a shallow growth compartment in the center and a deep feeding compartment around the periphery. Two compartments are connected with a narrow annular channel. A long crystal may be continuously grown by feeding silicon pellets into the dedicated feeding compartment. We use our numerical model to simulate temperature distribution and velocity field in a conventional 200-mm CZ crystal growth system and also in the new shallow crucible CZ system. By comparison, advantages and disadvantages of the proposed system are observed, operating conditions are determined, and the new system is improved.

  13. Transmutation doping of silicon solar cells

    Science.gov (United States)

    Wood, R. F.; Westbrook, R. D.; Young, R. T.; Cleland, J. W.

    1977-01-01

    Normal isotopic silicon contains 3.05% of Si-30 which transmutes to P-31 after thermal neutron absorption, with a half-life of 2.6 hours. This reaction is used to introduce extremely uniform concentrations of phosphorus into silicon, thus eliminating the areal and spatial inhomogeneities characteristic of chemical doping. Annealing of the lattice damage in the irradiated silicon does not alter the uniformity of dopant distribution. Transmutation doping also makes it possible to introduce phosphorus into polycrystalline silicon without segregation of the dopant at the grain boundaries. The use of neutron transmutation doped (NTD) silicon in solar cell research and development is discussed.

  14. Study of hot cracking potential in a 6-ton steel ingot casting

    Science.gov (United States)

    Yang, Jing'an; Liu, Baicheng; Shen, Houfa

    2018-04-01

    A new hot cracking potential (HCP) criterion, for the appearance of hot tearing in steel ingot castings, is proposed. The maximum value of the first principal stress, divided by the dynamic yield strength in the brittle temperature range (BTR), was used to identify the HCP. Experiments were carried out on a 6-ton P91 steel ingot in which severe hot tearing was detected in the upper centerline. Another ingot, with a better heat preservation riser, and without hot tearing, was used for comparison. Samples were obtained from the area of the ingot body with hot tearing, and their morphologies were inspected by a X-ray high energy industrial computed tomography. The carbon and sulfur distributions around the hot tearing were characterized by an infrared spectrometry carbon and sulfur analyzer. High temperature mechanical properties were obtained by a Gleeble thermal simulation machine, under different strain rates. Then, thermo-mechanical simulations using an elasto-viscoplastic finite-element model were conducted to analyze the stress and strain evolution during ingot solidification. The results showed that the hot tearing area, which was rich in both carbon and sulfur, was under excessive tensile stress in the BTR, bearing the highest HCP.

  15. Shrinkage Porosity Criterion and Its Application to A 5.5 Ton Steel Ingot

    Directory of Open Access Journals (Sweden)

    Zhang C.

    2016-06-01

    Full Text Available In order to predict the distribution of shrinkage porosity in steel ingot efficiently and accurately, a criterion R√L and a method to obtain its threshold value were proposed. The criterion R√L was derived based on the solidification characteristics of steel ingot and pressure gradient in the mushy zone, in which the physical properties, the thermal parameters, the structure of the mushy zone and the secondary dendrite arm spacing were all taken into consideration. The threshold value of the criterion R√L was obtained with combination of numerical simulation of ingot solidification and total solidification shrinkage rate. Prediction of the shrinkage porosity in a 5.5 ton ingot of 2Cr13 steel with criterion R√L>0.21 m · °C1/2 · s−3/2 agreed well with the results of experimental sectioning. Based on this criterion, optimization of the ingot was carried out by decreasing the height-to-diameter ratio and increasing the taper, which successfully eliminated the centreline porosity and further proved the applicability of this criterion.

  16. Microdefects in neutron-transmutationaly doped silicon

    International Nuclear Information System (INIS)

    Vysotskaya, V.V.; Gorin, S.N.; Gres'kov, I.M.; Sobolev, N.A.; Shek, E.I.

    1988-01-01

    Using the method of X-ray topography and high-voltage electron microscopy, the nature of microdefects and character of their changes in neutron-transmutationaly doped silicon depending on the sample prehistory and heat treatment (HT) conditions are refined. It is shown that the microstructure of neutron-transmutationaly doped dislocation-free silicon crystals depends on conditions of ingot growth and post-radiation annealing environment. Annealing in chlorine-containing atmosphere removes microdefects (MD), although in vacuum, argon or air growing MD are preserved and new MD are formed

  17. Microdefects in neutron-transmutationaly doped silicon

    Energy Technology Data Exchange (ETDEWEB)

    Vysotskaya, V V; Gorin, S N; Gres' kov, I M; Sobolev, N A; Shek, E I

    1988-03-01

    Using the method of X-ray topography and high-voltage electron microscopy, the nature of microdefects and character of their changes in neutron-transmutationaly doped silicon depending on the sample prehistory and heat treatment (HT) conditions are refined. It is shown that the microstructure of neutron-transmutationaly doped dislocation-free silicon crystals depends on conditions of ingot growth and post-radiation annealing environment. Annealing in chlorine-containing atmosphere removes microdefects (MD), although in vacuum, argon or air growing MD are preserved and new MD are formed.

  18. Application of neutron transmutation doping method to initially p-type silicon material.

    Science.gov (United States)

    Kim, Myong-Seop; Kang, Ki-Doo; Park, Sang-Jun

    2009-01-01

    The neutron transmutation doping (NTD) method was applied to the initially p-type silicon in order to extend the NTD applications at HANARO. The relationship between the irradiation neutron fluence and the final resistivity of the initially p-type silicon material was investigated. The proportional constant between the neutron fluence and the resistivity was determined to be 2.3473x10(19)nOmegacm(-1). The deviation of the final resistivity from the target for almost all the irradiation results of the initially p-type silicon ingots was at a range from -5% to 2%. In addition, the burn-up effect of the boron impurities, the residual (32)P activity and the effect of the compensation characteristics for the initially p-type silicon were studied. Conclusively, the practical methodology to perform the neutron transmutation doping of the initially p-type silicon ingot was established.

  19. Flat-plate solar array project. Volume 3: Silicon sheet: Wafers and ribbons

    Science.gov (United States)

    Briglio, A.; Dumas, K.; Leipold, M.; Morrison, A.

    1986-01-01

    The primary objective of the Silicon Sheet Task of the Flat-Plate Solar Array (FSA) Project was the development of one or more low cost technologies for producing silicon sheet suitable for processing into cost-competitive solar cells. Silicon sheet refers to high purity crystalline silicon of size and thickness for fabrication into solar cells. Areas covered in the project were ingot growth and casting, wafering, ribbon growth, and other sheet technologies. The task made and fostered significant improvements in silicon sheet including processing of both ingot and ribbon technologies. An additional important outcome was the vastly improved understanding of the characteristics associated with high quality sheet, and the control of the parameters required for higher efficiency solar cells. Although significant sheet cost reductions were made, the technology advancements required to meet the task cost goals were not achieved.

  20. Research and Development of the Solidification of Slab Ingots from Special Tool Steels

    Directory of Open Access Journals (Sweden)

    Tkadlečková M.

    2017-09-01

    Full Text Available The paper describes the research and development of casting and solidification of slab ingots from special tool steels by means of numerical modelling using the finite element method. The pre-processing, processing and post-processing phases of numerical modelling are outlined. Also, problems with determining the thermophysical properties of materials and heat transfer between the individual parts of the casting system are discussed. Based on the type of grade of tool steel, the risk of final porosity is predicted. The results allowed to improve the production technology of slab ingots, and also to verify the ratio, the chamfer and the external/ internal shape of the wall of the new designed slab ingots.

  1. Modelling the void deformation and closure by hot forging of ingot castings

    DEFF Research Database (Denmark)

    Christiansen, Peter; Hattel, Jesper Henri; Kotas, Petr

    2012-01-01

    by mechanical deformation. The aim of this paper is to analyze numerically if and to what degree the voids areclosed by the forging. Using the commercial simulation software ABAQUS, both simplified model ingots and physically manufactured ingots containing prescribed void distributions are deformed and analyzed....... The analysis concernsboth the void density change and the location of the voids in the part after deformation. The latter can be important for the subsequent reliability of the parts, for instance regarding fatigue properties. The analysis incorporates the Gurson yield criterion for metals containing voids...... and focuses on how the voids deform depending on their size and distribution in the ingot as well ashow the forging forces are applied....

  2. Metal induced crystallization of silicon germanium alloys

    Energy Technology Data Exchange (ETDEWEB)

    Gjukic, M.

    2007-05-15

    In the framework of this thesis the applicability of the aluminium-induced layer exchange on binary silicon germanium alloys was studied. It is here for the first time shown that polycrstalline silicon-germanium layers can be fabricated over the whole composition range by the aluminium-induced layer exchange. The experimental results prove thet the resulting material exhibits a polycrystalline character with typocal grain sizes of 10-100 {mu}m. Raman measurements confirm that the structural properties of the resulting layers are because of the large crystallites more comparable with monocrystalline than with nano- or microcrystalline silicon-germanium. The alloy ratio of the polycrystalline layer correspondes to the chemical composition of the amorphous starting layer. The polycrystalline silicon-germanium layers possess in the range of the interband transitions a reflection spectrum, as it is otherwise only known from monocrystalline reference layers. The improvement of the absorption in the photovoltaically relevant spectral range aimed by the application of silicon-germanium could be also proved by absorption measurments. Strongly correlated with the structural properties of the polycrystalline layers and the electronic band structure resulting from this are beside the optical properties also the electrical properties of the material, especially the charge-carrier mobility and the doping concentration. For binary silicon-germanium layers the hole concentration of about 2 x 10{sup 18} cm{sup -3} for pure silicon increrases to about 5 x 10{sup 20} cm{sub -3} for pure germanium. Temperature-resolved measurements were applied in order to detect doping levels respectively semiconductor-metal transitions. In the last part of the thesis the hydrogen passivation of polycrystalline thin silicon-germanium layers, which were fabricated by means of aluminium-induced layer exchange, is treated.

  3. Physical modeling and numerical simulation of V-die forging ingot with central void

    DEFF Research Database (Denmark)

    Christiansen, Peter; Hattel, Jesper Henri; Bay, Niels

    2014-01-01

    Numerical simulation and physical modeling performed on small-scale ingots made from pure lead, having a hole drilled through their centerline to mimic porosity, are utilized to characterize the deformation mechanics of a single open die forging compression stage and to identify the influence...... of the lower V-die angle on porosity closure and forging load requirements of large cast ingots. Results show that a lower V-die angle of 120 provides the best closure of centerline porosity without demanding the highest forging loads or developing unreasonably asymmetric shapes that may create difficulties...... in multi-stage open die forging procedures....

  4. Rayleigh Number Criterion for Formation of A-Segregates in Steel Castings and Ingots

    DEFF Research Database (Denmark)

    Rad, M. Torabi; Kotas, Petr; Beckermann, C.

    2013-01-01

    A Rayleigh number-based criterion is developed for predicting the formation of A-segregates in steel castings and ingots. The criterion is calibrated using available experimental data for ingots involving 27 different steel compositions. The critical Rayleigh number above which A-segregates can b......, the primary reason for this over-prediction is persumed to be the presence of a central zone of equiaxed grains in the casting sections. A-segregates do not form when the grain structure is equiaxed. © The Minerals, Metals & Materials Society and ASM International 2013...

  5. Improvement in the reliability of shells for light water reactors by manufacturing from hollow ingots

    International Nuclear Information System (INIS)

    Bocquet, P.; Blondeau, R.; Poitrault, I.; Badeau, J.P.; Dumont, R.

    1989-01-01

    The example of forging shells for PWR type reactors is proposed to show how the choice of the manufacturing process may be of prime importance for the component integrity by the reduction of the detrimental effects of segregations. The forging shells (20MnMoNi55) manufactured from hollow ingot are free of any segregation in the critical area located just at the internal surface and sub-surface. Manufacturing problems associated to these segregations in shells issued from conventional ingots, in particular welding difficulties for cladding, have been reduced or eleminated. The reliability of these components present an improved resistance to irradiation embrittlement. (DG)

  6. Peculiarities of the coolant of large ingots in crystallizators of semicontinuous casting machines

    International Nuclear Information System (INIS)

    Tsukerman, V.Ya.; Marchenko, I.K.; Rimen, V.Kh.

    1983-01-01

    Peculiarities of heat transfer in crystallizator of semicontinuous blank casting machine were investigated, taking carbon and chromium-nickel steels as an example. The effect of crystallizator cross-section and decrease of the rate of metal casting on ingot cooling was considered at that. It was established that nonuniformity of deformation of ingot skin as well as the state of crystallizator operating walls affect on heat transfer in crystallizator. Crystallizator structure with ribs in upper part and without ribs in lower cone part is optimal. It provides more uniform skin growth in initial period of solidification and compensation of gap, which appears due to shrinkage

  7. Transformational silicon electronics

    KAUST Repository

    Rojas, Jhonathan Prieto

    2014-02-25

    In today\\'s traditional electronics such as in computers or in mobile phones, billions of high-performance, ultra-low-power devices are neatly integrated in extremely compact areas on rigid and brittle but low-cost bulk monocrystalline silicon (100) wafers. Ninety percent of global electronics are made up of silicon. Therefore, we have developed a generic low-cost regenerative batch fabrication process to transform such wafers full of devices into thin (5 μm), mechanically flexible, optically semitransparent silicon fabric with devices, then recycling the remaining wafer to generate multiple silicon fabric with chips and devices, ensuring low-cost and optimal utilization of the whole substrate. We show monocrystalline, amorphous, and polycrystalline silicon and silicon dioxide fabric, all from low-cost bulk silicon (100) wafers with the semiconductor industry\\'s most advanced high-κ/metal gate stack based high-performance, ultra-low-power capacitors, field effect transistors, energy harvesters, and storage to emphasize the effectiveness and versatility of this process to transform traditional electronics into flexible and semitransparent ones for multipurpose applications. © 2014 American Chemical Society.

  8. "Silicon millefeuille": From a silicon wafer to multiple thin crystalline films in a single step

    Science.gov (United States)

    Hernández, David; Trifonov, Trifon; Garín, Moisés; Alcubilla, Ramon

    2013-04-01

    During the last years, many techniques have been developed to obtain thin crystalline films from commercial silicon ingots. Large market applications are foreseen in the photovoltaic field, where important cost reductions are predicted, and also in advanced microelectronics technologies as three-dimensional integration, system on foil, or silicon interposers [Dross et al., Prog. Photovoltaics 20, 770-784 (2012); R. Brendel, Thin Film Crystalline Silicon Solar Cells (Wiley-VCH, Weinheim, Germany 2003); J. N. Burghartz, Ultra-Thin Chip Technology and Applications (Springer Science + Business Media, NY, USA, 2010)]. Existing methods produce "one at a time" silicon layers, once one thin film is obtained, the complete process is repeated to obtain the next layer. Here, we describe a technology that, from a single crystalline silicon wafer, produces a large number of crystalline films with controlled thickness in a single technological step.

  9. Acoustic emission from polycrystalline graphites

    International Nuclear Information System (INIS)

    Ioka, I.; Yoda, S.; Oku, T.; Miyamoto, Y.

    1987-01-01

    Acoustic emission was monitored from polycrystalline graphites with different microstructure (pore size and pore volume) subjected to compressive loading. The graphites used in this study comprised five brands, that is, PGX, ISEM-1, IG-11, IG-15, and ISO-88. A root mean square (RMS) voltage and event counts of acoustic emission for graphites were measured during compressive loading. The acoustic emission was measured using a computed-based data acquisition and analysis system. The graphites were first deformed up to 80 % of the average fracture stress, then unloaded and reloaded again until the fracture occured. During the first loading, the change in RMS voltage for acoustic emission was detected from the initial stage. During the unloading, the RMS voltage became zero level as soon as the applied stress was released and then gradually rose to a peak and declined. The behavior indicated that the reversed plastic deformation occured in graphites. During the second loading, the RMS voltage gently increased until the applied stress exceeded the maximum stress of the first loading; there is no Kaiser effect in the graphites. A bicrystal model could give a reasonable explanation of this results. The empirical equation between the ratio of σ AE to σ f and σ f was obtained. It is considered that the detection of microfracture by the acoustic emission technique is effective in macrofracture prediction of polycrystalline graphites. (author)

  10. Laser process for extended silicon thin film solar cells

    International Nuclear Information System (INIS)

    Hessmann, M.T.; Kunz, T.; Burkert, I.; Gawehns, N.; Schaefer, L.; Frick, T.; Schmidt, M.; Meidel, B.; Auer, R.; Brabec, C.J.

    2011-01-01

    We present a large area thin film base substrate for the epitaxy of crystalline silicon. The concept of epitaxial growth of silicon on large area thin film substrates overcomes the area restrictions of an ingot based monocrystalline silicon process. Further it opens the possibility for a roll to roll process for crystalline silicon production. This concept suggests a technical pathway to overcome the limitations of silicon ingot production in terms of costs, throughput and completely prevents any sawing losses. The core idea behind these thin film substrates is a laser welding process of individual, thin silicon wafers. In this manuscript we investigate the properties of laser welded monocrystalline silicon foils (100) by micro-Raman mapping and spectroscopy. It is shown that the laser beam changes the crystalline structure of float zone grown silicon along the welding seam. This is illustrated by Raman mapping which visualizes compressive stress as well as tensile stress in a range of - 147.5 to 32.5 MPa along the welding area.

  11. The Structural Evolution and Segregation in a Dual Alloy Ingot Processed by Electroslag Remelting

    Directory of Open Access Journals (Sweden)

    Yu Liu

    2016-12-01

    Full Text Available The structural evolution and segregation in a dual alloy made by electroslag remelting (ESR was investigated by various analytical techniques. The results show that the macrostructure of the ingot consists of two crystallization structures: one is a quite narrow, fine, equiaxed grain region at the edge and the other is a columnar grain region, which plays a leading role. The typical columnar structure shows no discontinuity between the CrMoV, NiCrMoV, and transition zones. The average secondary arm-spacing is coarsened from 35.3 to 49.2 μm and 61.5 μm from the bottom to the top of the ingot. The distinctive features of the structure are attributed to the different cooling conditions during the ESR process. The Ni, Cr, and C contents markedly increase in the transition zone (TZ and show a slight increase from the bottom to the top and from the surface to the center of the ESR ingot due to the partition ratios, gravity segregation, the thermal buoyancy flow, the solutal buoyancy flow, and the inward Lorentz force. Less dendrite segregation exists in the CrMoV zone and the transition zone due to a stronger cooling rate (11.1 and 4.5 °C/s and lower Cr and C contents. The precipitation of carbides was observed in the ingot due to a lower solid solubility of the carbon element in the α phase.

  12. Production and fabrication of 2500-lb Nb--Ti ingots to rod

    International Nuclear Information System (INIS)

    Cordier, T.E.; McDonald, W.K.

    1975-01-01

    Interest in Nb--Ti superconducting devices is exploding. This paper outlines the critical production criteria for this material. Areas discussed include ingot blending, melting, forging, extrusion, and rod reducing with emphasis on the metallurgical considerations affecting mechanical properties. Data are included relating process parameters to TEM finding as well as R.T. ductility and optical microscopy

  13. Evaluation of Metallurgical Quality of Master Heat IN-713C Nickel Alloy Ingots

    Directory of Open Access Journals (Sweden)

    F. Binczyk

    2012-12-01

    Full Text Available The paper presents the results of evaluation of the metallurgical quality of master heat ingots and of the identification of non-metallic inclusions (oxides of Al., Zr, Hf, Cr, etc., which have been found in the shrinkage cavities formed in these ingots. The inclusions penetrate into the liquid alloy, and on pouring of mould are transferred to the casting, especially when the filtering system is not sufficiently effective. The specific nature of the melting process of nickel and cobalt alloys, carried out in vacuum induction furnaces,excludes the possibility of alloy refining and slag removal from the melt surface. Therefore, to improve the quality of castings (parts of aircraft engines, it is so important to evaluate the quality of ingots before charging them into the crucible of an induction furnace. It has been proved that one of the methods for rapid quality evaluation is an ATD analysis of the sample solidification process, where samples are taken from different areas of the master heat ingot. The evaluation is based on a set of parameters plotted on the graph of the dT/dt derivative curve during the last stage of the solidification process in a range from TEut to Tsol.

  14. Evaluation of Metallurgical Quality of Master Heat IN-713C Nickel Alloy Ingots

    Directory of Open Access Journals (Sweden)

    Binczyk F.

    2012-12-01

    Full Text Available The paper presents the results of evaluation of the metallurgical quality of master heat ingots and of the identification of non-metallic inclusions (oxides of Al., Zr, Hf, Cr, etc., which have been found in the shrinkage cavities formed in these ingots. The inclusions penetrate into the liquid alloy, and on pouring of mould are transferred to the casting, especially when the filtering system is not sufficiently effective. The specific nature of the melting process of nickel and cobalt alloys, carried out in vacuum induction furnaces, excludes the possibility of alloy refining and slag removal from the melt surface. Therefore, to improve the quality of castings (parts of aircraft engines, it is so important to evaluate the quality of ingots before charging them into the crucible of an induction furnace. It has been proved that one of the methods for rapid quality evaluation is an ATD analysis of the sample solidification process, where samples are taken from different areas of the master heat ingot. The evaluation is based on a set of parameters plotted on the graph of the dT/dt derivative curve during the last stage of the solidification process in a range from TEut to Tsol.

  15. On the Modeling of Thermal Radiation at the Top Surface of a Vacuum Arc Remelting Ingot

    Science.gov (United States)

    Delzant, P.-O.; Baqué, B.; Chapelle, P.; Jardy, A.

    2018-06-01

    Two models have been implemented for calculating the thermal radiation emitted at the ingot top in the VAR process, namely, a crude model that considers only radiative heat transfer between the free surface and electrode tip and a more detailed model that describes all radiative exchanges between the ingot, electrode, and crucible wall using a radiosity method. From the results of the second model, it is found that the radiative heat flux at the ingot top may depend heavily on the arc gap length and the electrode radius, but remains almost unaffected by variations of the electrode height. Both radiation models have been integrated into a CFD numerical code that simulates the growth and solidification of a VAR ingot. The simulation of a Ti-6-4 alloy melt shows that use of the detailed radiation model leads to some significant modification of the simulation results compared with the simple model. This is especially true during the hot-topping phase, where the top radiation plays an increasingly important role compared with the arc energy input. Thus, while the crude model has the advantage of its simplicity, use of the detailed model should be preferred.

  16. Superconducting radio-frequency cavities made from medium and low-purity niobium ingots

    International Nuclear Information System (INIS)

    Ciovati, Gianluigi; Dhakal, Pashupati; Myneni, Ganapati R

    2016-01-01

    Superconducting radio-frequency cavities made of ingot niobium with residual resistivity ratio (RRR) greater than 250 have proven to have similar or better performance than fine-grain Nb cavities of the same purity, after standard processing. The high purity requirement contributes to the high cost of the material. As superconducting accelerators operating in continuous-wave typically require cavities to operate at moderate accelerating gradients, using lower purity material could be advantageous not only to reduce cost but also to achieve higher Q 0 -values. In this contribution we present the results from cryogenic RF tests of 1.3–1.5 GHz single-cell cavities made of ingot Nb of medium (RRR = 100–150) and low (RRR = 60) purity from different suppliers. Cavities made of medium-purity ingots routinely achieved peak surface magnetic field values greater than 70 mT with an average Q 0 -value of 2 × 10 10 at 2 K after standard processing treatments. The performances of cavities made of low-purity ingots were affected by significant pitting of the surface after chemical etching. (paper)

  17. Superconducting radio-frequency cavities made from medium and low-purity niobium ingots

    Science.gov (United States)

    Ciovati, Gianluigi; Dhakal, Pashupati; Myneni, Ganapati R.

    2016-06-01

    Superconducting radio-frequency cavities made of ingot niobium with residual resistivity ratio (RRR) greater than 250 have proven to have similar or better performance than fine-grain Nb cavities of the same purity, after standard processing. The high purity requirement contributes to the high cost of the material. As superconducting accelerators operating in continuous-wave typically require cavities to operate at moderate accelerating gradients, using lower purity material could be advantageous not only to reduce cost but also to achieve higher Q 0-values. In this contribution we present the results from cryogenic RF tests of 1.3-1.5 GHz single-cell cavities made of ingot Nb of medium (RRR = 100-150) and low (RRR = 60) purity from different suppliers. Cavities made of medium-purity ingots routinely achieved peak surface magnetic field values greater than 70 mT with an average Q 0-value of 2 × 1010 at 2 K after standard processing treatments. The performances of cavities made of low-purity ingots were affected by significant pitting of the surface after chemical etching.

  18. Analysis of internal crack in a six-ton P91 ingot

    Directory of Open Access Journals (Sweden)

    Jing-an Yang

    2016-05-01

    Full Text Available P91 is a new kind of heat-resistant and high-tensile steel. It can be extruded after ingot casting and can be widely used for different pipes in power plants. However, due to its mushy freezing characteristics, a lack of feeding in the ingot center often generates many defects, such as porosity and crack. A six-ton P91 ingot was cast and sliced, and a representative part of the longitudinal section was inspected in more detail. The morphology of crack-like defects was examined by X-ray high energy industrial CT and reconstructed by 3D software. There are five main portions of defects larger than 200 mm3, four of which are interconnected. These initiated from continuous liquid film, and then were torn apart by excessive tensile stress within the brittle temperature range (BTR. The 3D FEM analysis of thermo-mechanical simulation was carried out to analyze the formation of porosity and internal crack defects. The results of shrinkage porosity and Niyama values revealed that the center of the ingot suffers from inadequate feeding. Several criteria based on thermal and mechanical models were used to evaluate the susceptibility of hot crack formation. The Clyne and Davies’ criterion and Katgerman’s criterion successfully predicted the high hot crack susceptibility in the ingot center. Six typical locations in the longitudinal section had been chosen for analysis of the stresses and strains evolution during the BTR. Locations in the defects region showed the highest tensile stresses and relative high strain values, while other locations showed either low tensile stresses or low strain values. In conclusion, hot crack develops only when stress and strain exceed a threshold value at the same time during the BTR.

  19. Sequential purification and crystal growth for the production of low cost silicon substrates. Quarterly technical progress report No. 1, 15 September 1979-31 December 1979

    Energy Technology Data Exchange (ETDEWEB)

    Liaw, M.; Secco, F.; Ingle, B.; Down, D.

    1980-02-01

    Over the past several years, Motorola's Materials Technology Laboratory (MTL), has been conducting several projects with goals directed at the production of high quality low cost silicon crystals. One of the projects which is being investigated is the direct purification of MG-Si. A unique characteristic of the approach used by this project is the use of a crystal puller to perform both purification and crystal growth. Sequential steps of purification were taken. By the completion of this series of purification, the purified MG-Si melt will be further purified by impurity redistribution using ingot pulling. The final purified silicon will be in an ingot form of desired dimensions for slicing into silicon sheets. The sequential steps of purification include: (1) leaching of MG-Si charge, (2) phase separation, (3) reactive gas treatment, (4) liquid-liquid extraction (called Slagging), and (5) purification by redistribution of impurities using ingot pulling. Progress on items (1) and (2) is reported. (WHK)

  20. Piezoresistive effect in top-down fabricated silicon nanowires

    DEFF Research Database (Denmark)

    Reck, Kasper; Richter, Jacob; Hansen, Ole

    2008-01-01

    We have designed and fabricated silicon test chips to investigate the piezoresistive properties of both crystalline and polycrystalline nanowires using a top-down approach, in order to comply with conventional fabrication techniques. The test chip consists of 5 silicon nanowires and a reference...

  1. Correlation of NTD-silicon rod and slice resistivity

    International Nuclear Information System (INIS)

    Wolverton, W.M.

    1984-01-01

    Neutron transmutation doped silicon is an electronic material which presents an opportunity to explore a high level of resistivity characterization. This is due to its excellent uniformity of dopant concentration. Appropriate resistivity measurements on the ingot raw material can be used as a predictor of slice resistivity. Correlation of finished NTD rod (i.e. ingot) resistivity to as-cut slice resistivity (after the sawing process) is addressed in the scope of this paper. Empirical data show that the shift of slice-center resistivity compared to rod-end center resistivity is a function of a new kind of rod radial-resistivity gradient. This function has two domains, and most rods are in domain ''A''. Correlating equations show how to significantly improve the prediction of slice resistivity of rods in domain ''A''. The new rod resistivity specifications have resulted in manufacturing economies in the production of NTD silicon slices

  2. Feasibility study on silicon doping using high temperature test engineering reactor

    International Nuclear Information System (INIS)

    Seki, Masaya; Takaki, Naoyuki; Goto, Minoru; Shimakawa, Satoshi

    2011-01-01

    The feasibility study on silicon doping using the High Temperature engineering Test Reactor (HTTR) is performed by numerical simulations. The HTTR is a High Temperature Gas-cooled Reactor (HTGR) situated at JAEA Oarai research and development center. It has a 30MW thermal power and the outlet coolant temperature is 950degC. The objective of this study is to evaluate the following issues, 1. The impact of loading Si-ingots into the core on the criticality, 2. The uniformity of the neutron capture reaction rate in Si-ingots, and 3. The production rate of silicon semiconductor. In this study, six Si-ingots are loaded into the irradiation area which is located in the peripheral region of the core. They are irradiated with rotation movement around the axial direction to obtain uniform neutron capture reaction rate in the radial direction. Additionally, the neutron filter, which is made of graphite containing boron, is used to obtain uniform neutron capture reaction rate in the axial direction. The evaluations were conducted by performing the HTTR whole core calculations with the Monte Carlo code MVP-2.0. In the calculations, several tally regions were defined on the Si-ingots to investigate the uniformity of the neutron capture reaction rate. As a result, loading the Si-ingots into the core causes negative reactivity by about 0.7%dk/k. Uniform neutron capture reaction rate of Si-ingot is obtained 98% in the radial and the axial direction. In case of the target of semiconductor resistivity is set to 50 Ωcm, the required irradiation time becomes 10 hours. The HTTR is able to produce silicon semiconductor of 540kg in one-time irradiation. This study was conducted as a joint research with JAEA, Nuclear Fuel Industries, LTD, Toyota Tsusho Corporation and Tokai University. (author)

  3. Defects generation by hydrogen passivation of polycrystalline silicon thin films

    Czech Academy of Sciences Publication Activity Database

    Honda, Shinya; Mates, Tomáš; Ledinský, Martin; Fejfar, Antonín; Kočka, Jan; Yamazaki, T.; Uraoka, Y.; Fuyuki, T.; Boldyryeva, Hanna; Macková, Anna; Peřina, Vratislav

    2006-01-01

    Roč. 80, - (2006), s. 653-657 ISSN 0038-092X R&D Projects: GA MŽP(CZ) SM/300/1/03; GA MŽP(CZ) SN/3/172/05; GA AV ČR IAA1010413; GA ČR(CZ) GD202/05/H003; GA AV ČR IAA1010316 Institutional research plan: CEZ:AV0Z10100521; CEZ:AV0Z10480505 Keywords : hydrogen passivation * ERDA * photoluminescence * Raman spectroscopy * Si-H 2 bonding * H 2 molecules * grain size. Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.431, year: 2006

  4. Polycrystalline silicon thin-film solar cells on glass

    Energy Technology Data Exchange (ETDEWEB)

    Gall, S.; Becker, C.; Conrad, E.; Dogan, P.; Fenske, F.; Gorka, B.; Lee, K.Y.; Rau, B.; Ruske, F.; Rech, B. [Helmholtz-Zentrum Berlin fuer Materialien und Energie GmbH (formerly Hahn-Meitner-Institut Berlin GmbH), Department Silicon Photovoltaics (SE1), Kekulestr. 5, D-12489 Berlin (Germany)

    2009-06-15

    Poly-Si thin-film solar cells on glass feature the potential to reach single-junction efficiencies of 15% or even higher at low costs. In this paper innovative approaches are discussed, which could lead to substantial efficiency improvements and significant cost reductions: (i) preparation of large-grained poly-Si films using the 'seed layer concept' targeting at high material quality, (ii) utilization of ZnO:Al-coated glass enabling simple contacting and light-trapping schemes, (iii) utilization of high-rate electron-beam evaporation for the absorber deposition offering a high potential for cost reduction. (author)

  5. Constrained/unconstrained solidification within the massive cast steel/iron ingots

    Directory of Open Access Journals (Sweden)

    W. S. Wołczyński

    2010-04-01

    Full Text Available Some properties of the ingot and especially of the steel forging ingots depend on the ratio of a columnar structure area to an equiaxed structure area created during solidification. The C-E transition is fundamental phenomenon that can be applied to characterize massive cast steel ingots produced by the casting house. The mentioned ratio is created spontaneously due to the rate of heat transfer towards the ceramic mould and then to the environment. The ceramic mould operates as an isolator. So that the thickness of the mould together with a growing solid fraction control the heat transfer and finally the ratio of the columnar structure area to the equiaxed structure area. At first the increase of heat accumulation within the ceramic mould is observed. Next the stationary state for heat transfer is created and finally a gentle abatement of the mould temperature associated with the heat output to the environment is expected. The steep thermal gradients correspond to the increase of heat accumulation in the ceramic mould. The steep thermal gradients are required to promote the columnar structure formation. The full heat accumulation in the mould corresponds well with the C-E transformation while the appearance of the moderate thermal gradients is referred to the gentle temperature abatement within the ceramic mould. The equiaxed structure is expected within this period of heat transfer behavior. The steep thermal gradients involve the activity of viscosity gradient in the liquid. As the result a sedimentary cones are formed at the bottom of the ingot. The C-E transformation is associated with competition between columnar and equaixed structure formation. At the end of competition a fully equiaxed structure is formed. The viscosity gradient is replaced by the thermophoresis which is the driving force for the deposition of some equiaxed grain layers onto the surface of C+E zone. The convection together with the gravity allow the layers to be uniform

  6. Microdamage in polycrystalline ceramics under dynamic compression and tension

    International Nuclear Information System (INIS)

    Zhang, K.S.; Zhang, D.; Feng, R.; Wu, M.S.

    2005-01-01

    In-grain microplasticity and intergranular microdamage in polycrystalline hexagonal-structure ceramics subjected to a sequence of dynamic compression and tension are studied computationally using the Voronoi polycrystal model, by which the topological heterogeneity and material anisotropy of the crystals are simulated explicitly. The constitutive modeling considers crystal plasticity by basal slip, intergranular shear damage during compression, and intergranular mode-I cracking during tension. The model parameters are calibrated with the available shock compression and spall strength data on polycrystalline α-6H silicon carbide. The numerical results show that microplasticity is a more plausible micromechanism for the inelastic response of the material under shock compression. On the other hand, the spallation behavior of the shocked material can be well predicted by intergranular mode-I microcracking during load reversal from dynamic compression to tension. The failure process and the resulting spall strength are, however, affected strongly by the intensity of local release heterogeneity induced by heterogeneous microplasticity, and by the grain-boundary shear damage during compression

  7. High vacuum tribology of polycrystalline diamond coatings

    Indian Academy of Sciences (India)

    Polycrystalline diamond coatings; hot filament CVD; high vacuum tribology. 1. Introduction .... is a characteristic of graphite. We mark the (diamond ... coefficient of friction due to changes in substrate temperature. The average coefficient of.

  8. Modeling and Optimization of Direct Chill Casting to Reduce Ingot Cracking

    Energy Technology Data Exchange (ETDEWEB)

    Das, Subodh K.

    2006-01-09

    A successful four-year project on the modeling and optimization of direct chill (DC) casting to reduce ingot cracking has been completed. The project involved close collaboration among private industries, national laboratories, and universities. During the four-year project, 16 quarterly meetings brought the industrial partners and the research team together for discussion of research results and research direction. The industrial partners provided guidance, facilities, and experience to the research team. The research team went to two industrial plants to measure temperature distributions in commercial 60,000-lb DC casting ingot. The collaborative research resulted in several major accomplishments or findings: (1) Surface cracks were shown to be a result of hot tearing rather than cold cracks, as was thought before this project. These cracks form on the surface of a DC cast ingot just above the impingement point of the secondary cooling water jets. The cracks form along dendrite and grain boundaries, where solute and impurity elements are highly segregated. This understanding led to the development of a new technique for determining the mechanical properties in the nonequilibrium mushy zone of alloys and to thermodynamic predictions of the hot tearing propensity of DC cast ingots. (2) The apparent heat transfer coefficient (HTC) at the ingot surface in the water cooling region during DC casting was determined on the basis of temperature measurements in commercial DC casting ingots and an inverse heat transfer analysis. HTCs were calculated as a function of temperature and time, and covered the different regimes of heat transfer expected during DC casting. The calculated values were extrapolated to include the effect of water flow rate. The calculated HTCs had a peak at around 200 C, corresponding to the high heat transfer rates during nucleate boiling, and the profile was consistent with similar data published in the literature. (3) A new method, termed the

  9. Electrical properties of pressure quenched silicon by thermal spraying

    International Nuclear Information System (INIS)

    Tan, S.Y.; Gambino, R.J.; Sampath, S.; Herman, H.

    2007-01-01

    High velocity thermal spray deposition of polycrystalline silicon film onto single crystal substrates, yields metastable high pressure forms of silicon in nanocrystalline form within the deposit. The phases observed in the deposit include hexagonal diamond-Si, R-8, BC-8 and Si-IX. The peculiar attribute of this transformation is that it occurs only on orientation silicon substrate. The silicon deposits containing the high pressure phases display a substantially higher electrical conductivity. The resistivity profile of the silicon deposit containing shock induced metastable silicon phases identified by X-ray diffraction patterns. The density of the pressure induced polymorphic silicon is higher at deposit/substrate interface. A modified two-layer model is presented to explain the resistivity of the deposit impacted by the pressure induced polymorphic silicon generated by the thermal spraying process. The pressure quenched silicon deposits on the p - silicon substrate, with or without metastable phases, display the barrier potential of about 0.72 eV. The measured hall mobility value of pressure quenched silicon deposits is in the range of polycrystalline silicon. The significance of this work lies in the fact that the versatility of thermal spray may enable applications of these high pressure forms of silicon

  10. Ingot formation using uranium dendrites recovered by electrolysis in LiCl-KCl-PuCl3-UCl3 melt

    International Nuclear Information System (INIS)

    Mineo Fukushima; Akira Nakayoshi; Shinichi Kitawaki; Masaki Kurata; Noboru Yahagi

    2008-01-01

    Products on solid cathodes recovered by the metal pyrochemical processing were processed to obtain uranium ingot. Studies on process conditions of uranium formation, assay recovered uranium products and by-products and evaluation of mass balance were carried out. In these tests, it is confirmed that uranium ingots can be obtained with heating the products more than melting temperature of metal uranium under atmospheric pressure because adhered salt cover the uranium not to oxidize it during uranium cohering. Covered salt can be removed after ingot formation. Inside the ingot, there were a lump of uranium and dark brown colored dross was observed. Material balance of uranium is 77 ∼ 96%, that of plutonium is 71 ∼ 109%, and that of americium that is a volatile substance more than uranium and plutonium become 79 ∼ 119%. Volatilization of americium is very small under the condition of high temperature. (authors)

  11. The Influence of Impurities in Feed Ingots on the Quality of Castings Made from Nickel Superalloy IN-713C

    Directory of Open Access Journals (Sweden)

    Binczyk F.

    2013-12-01

    Full Text Available The paper presents the results of research on the impact of impurities in the feed ingots (master heat on the precipitation of impurities in the ATD thermal analysis probe castings. This impurities occur mostly inside shrinkage cavities and in interdendritic space. Additionally, insufficient filtration of liquid alloy during pouring promotes the transfer of impurities into the casting. The technology of melting superalloys in vacuum furnace prevents the removal of slag from the surface of molten metal. Because of that, the effective method of quality assessment of feed ingots in order to evaluate the existence of impurities is needed. The effectiveness of ATD analysis in evaluation of purity of feed ingots was researched. In addition the similarities of non-metallic inclusions in feed ingots and in castings were observed.

  12. Development and Manufacturing Technology of Prototype Monoblock Low Pressure Rotor Shaft by 650ton Large Ingot

    Energy Technology Data Exchange (ETDEWEB)

    Song, Duk-Yong; Kim, Dong-Soo; Kim, Jungyeup; Lee, Jongwook; Ko, Seokhee [Doosan Heavy Industries and Construction, Changwon(Korea, Republic of)

    2016-10-15

    In order to establish the manufacturing technology for monoblock LP rotor shaft, DHI has produced the prototype monoblock LP rotor shaft with a maximum diameter of φ 2,800 mm using 650 ton ingot and investigated the mechanical properties and the internal quality of the ingot. As a result, the quality and mechanical properties required the large rotor shaft for nuclear power plant met a target. These results indicate that DHI can be contributed to increasing demands with high efficiency and capacity at the nuclear power plant. Additionally, some tests such as high cycle fatigue (HCF), low cycle fatigue (LCF), fracture toughness (K1C/J1C) and dynamic crack propagation velocity (da/dN) are in progress.

  13. Improvement in the reliability of shells for light water reactors by manufacture from hollow ingots

    International Nuclear Information System (INIS)

    Bocquet, P.; Blondeau, R.; Poitrault, I.; Badeau, J.P.; Dumont, R.

    1991-01-01

    The problems associated to the segregation located at the inner surface and subsurface of heavy shell forgings used in nuclear light water reactors are presented. The effect of A segregation on cold or reheat cracking HAZ has conducted fabricators to use severe welding procedures with high preheat temperature and refining HAZ grain size sequences. For shells and rings, the hollow ingot as developed by CLI, with a good control of the location of the center line of segregation, is an excellent answer to these problems. The use of core shell forgings issued from this type of hollow ingots, free of segregation at the inner surface and subsurface area, contributes, by reducing the irradiation embrittlement effect, to increase the safety factor relatively to the risk of failure of the reactor. (orig.)

  14. Evolution of ESR Technology and Equipment for Long Hollow Ingots Manufacture

    Science.gov (United States)

    Medovar, Lev; Stovpchenko, Ganna; Dudka, Grigory; Kozminskiy, Alexander; Fedorovskii, Borys; Lebid, Vitalii; Gusiev, Iaroslav

    In this paper development of both ESR technology and equipment for hollow ingot manufacture review and analysis are presented. The real complications of hollow ingot manufacture and some tendentious issues which restrict process dissemination are discussed. An actual data of modern manufacture of as-cast pipes for heat and power engineering by traditional ESR with consumable electrode are given. Results of microstructure and nonmetal inclusion investigations have shown the high quality of as-cast ESR pipes. On the basis of these results the possibility to produce huge ESR hollows (up 5000 mm in dia) with final goal drastically to reduce setting ratio on forged shells and rings or even replace it by ESR hollows as-cast is grounded. Two new ESR technologies — consumable electrodes change and liquid metal usage — have passed pilot tests for heavy hollow production and shown very prospective results to be presented.

  15. Silicon crystal growth using a liquid-feeding Czochralski method

    Science.gov (United States)

    Shiraishi, Yutaka; Kurosaka, Shoei; Imai, Masato

    1996-09-01

    Silicon single crystals with uniformity along the growth direction were grown using a new continuous Czochralski (CCZ) method. Polycrystalline silicon rods used as charge materials are melted by carbon heaters over a crucible without contact between the raw material and other substances. Using this method, silicon crystals with diameters as large as 6 or 8 inch and good uniformity along the growth direction were grown.

  16. NUMERICAL MODELING OF STRESSES NEAR THE SURFACE IN THE INGOT OF CIRCULAR SECTION, CRYSTALLIZABLE AT CIRCULAR TORCH SECONDARY COOLING

    Directory of Open Access Journals (Sweden)

    A. N. Chichko

    2004-01-01

    Full Text Available The results of computer calculations of the stresses, generated in outside layer of ingot of steel 20 of circular section with diameter 300 mm, in application to one of the industrial technological schemas of RUP “BMZ”, are presented. The segments of compressive and tensile stresses formation along the length of ingot are determined and the principal possibility of production of continuously cast slug of circular section at circular-torch spray cooling is shown.

  17. The Mathematical Model of Hydrodynamics and Heat and Mass Transfer at Formation of Steel Ingots and Castings

    Directory of Open Access Journals (Sweden)

    Bondarenko V.I.

    2015-03-01

    Full Text Available The generic mathematical model and computational algorithm considering hydrodynamics, heat and mass transfer processes during casting and forming steel ingots and castings are offered. Usage domains for turbulent, convective and non-convective models are determined depending on ingot geometry and thermal overheating of the poured melt. The expert system is developed, enabling to choose a mathematical model depending on the physical statement of a problem.

  18. The certification of boron in primary ingot aluminium. BCR No.25

    International Nuclear Information System (INIS)

    Vandecasteele, C.; Colinet, E.

    1984-01-01

    This report sets out the experimental procedures used for the certification of boron in primary ingot aluminium, which has already been certified for carbon and oxygen. Samples were analysed by seven different laboratories using the following methods: spectrophotometry, ICP-emission spectrometry, isotope dilution mass spectrometry, spark source mass spectrometry and charged particle activation analysis. The analytical methods and the statistical approach to analyse the data are described

  19. Inductive ingot heating for extrusion press applications; Induktive Bolzenerwaermung fuer Strangpressanwendungen

    Energy Technology Data Exchange (ETDEWEB)

    Beer, Stefan [I.A.S. Induktions-Anlagen + Service GmbH und Co. KG, Iserlohn (Germany)

    2013-03-15

    Inductive heating of large-format aluminium ingots on modern extrusion press lines generates significant process-engineering benefits. In addition, the proportion of special alloys processed is continuously increasing, accompanied simultaneously by ever smaller production batches, both of which are factors necessitating improvement of and greater flexibility in process-cycle control. This report examines a system concept recently commissioned on one of the world's largest aluminium extrusion presses. (orig.)

  20. Intensification of heating processes of ingots in top-fired pit furnaces

    International Nuclear Information System (INIS)

    Kotlyarevskij, E.M.; Bazhenov, A.V.; Zavarova, I.S.; Baboshin, V.M.; Ioffe, Ya.E.

    1978-01-01

    The soaking pits provided with only one upper burner are characterized by the non-uniformity of the temperature field. It is suggested to improve the gas-burner device and the smoke flue for obviating that draw-back. It is the application of new compositions of dry materials for building up the bottom (preventing its growth) and the rational arrangement of cold ingots of the 12Kh18N10T steel (with their bottom part widened upward) that allowed the bottom crops to be reduced by about 0.5% (abs. %), and the temperature at the end of rolling ingots to be increased by about 40 degrees. According to the temperature readings, the most representative point in the soaking pit has been determined. If the preheating process is carried out automatically in accordance with that representative point, the calculated rational modes of the rapid preheating of ingots may be realized, and the consumption of the conventional fuel may be reduced by about 3 to 5 kg/ton of steel

  1. Proposed sale of radioactively contaminated nickel ingots located at the Paducah Gaseous Diffusion Plant, Paducah, Kentucky

    International Nuclear Information System (INIS)

    1995-10-01

    The U.S. Department of Energy (DOE) proposes to sell 8,500 radioactively contaminated nickel ingots (9.350 short tons), currently in open storage at the Paducah Gaseous Diffusion Plant (PGDP), to Scientific Ecology Group, Inc. (SEG) for decontamination and resale on the international market. SEG would take ownership of the ingots when they are loaded for transport by truck to its facility in Oak Ridge, Tennessee. SEG would receive approximately 200 short tons per month over approximately 48 months (an average of 180 ingots per month). The nickel decontamination process specified in SEG's technical proposal is considered the best available technology and has been demonstrated in prototype at SEG. The resultant metal for resale would have contamination levels between 0.3 and 20 becquerel per gram (Bq/g). The health hazards associated with release of the decontaminated nickel are minimal. The activity concentration of the end product would be further reduced when the nickel is combined with other metals to make stainless steel. Low-level radioactive waste from the SEG decontamination process, estimated to be approximately 382 m 3 (12,730 ft), would be shipped to a licensed commercial or DOE disposal facility. If the waste were packaged in 0.23 m 3 -(7.5 ft 3 -) capacity drums, approximately 1,500 to 1,900 drums would be transported over the 48-month contract period. Impacts from the construction of decontamination facilities and the selected site are minimal

  2. Chemical Separation of Fission Products in Uranium Metal Ingots from Electrolytic Reduction Process

    International Nuclear Information System (INIS)

    Lee, Chang-Heon; Kim, Min-Jae; Choi, Kwang-Soon; Jee, Kwang-Yong; Kim, Won-Ho

    2006-01-01

    Chemical characterization of various process materials is required for the optimization of the electrolytic reduction process in which uranium dioxide, a matrix of spent PWR fuels, is electrolytically reduced to uranium metal in a medium of LiCl-Li 2 O molten at 650 .deg. C. In the uranium metal ingots of interest in this study, residual process materials and corrosion products as well as fission products are involved to some extent, which further adds difficulties to the determination of trace fission products. Besides it, direct inductively coupled plasma atomic emission spectrometric (ICP-AES) analysis of uranium bearing materials such as the uranium metal ingots is not possible because a severe spectral interference is found in the intensely complex atomic emission spectra of uranium. Thus an adequate separation procedure for the fission products should be employed prior to their determinations. In present study ion exchange and extraction chromatographic methods were adopted for selective separation of the fission products from residual process materials, corrosion products and uranium matrix. The sorption behaviour of anion and tri-nbutylphosphate (TBP) extraction chromatographic resins for the metals in acidic solutions simulated for the uranium metal ingot solutions was investigated. Then the validity of the separation procedure for its reliability and applicability was evaluated by measuring recoveries of the metals added

  3. Simulation of ingot casting processes at Deutsche Edelstahlwerke GmbH®

    International Nuclear Information System (INIS)

    Hartmann, L; Ernst, C; Klung, J-S

    2012-01-01

    To enhance the quality of tool steels it is necessary to analyse all stages of the production process. During the ingot- or continuous casting processes and the following solidification, material and geometry depending reactions cause defects such as macro segregations or porosities. In former times the trial and error approach, together with the experience and creativity of the steelworks engineers was used to improve the as-cast quality, with a high amount of test procedures and a high demand of research time and costs. Further development in software and algorithms has allowed modern simulation techniques to find their way into industrial steel production and casting-simulations are widely used to achieve an accurate prediction of the ingot quality. To improve the as-cast quality, several ingot casting processes of tool steels were studied at the R and D department of Deutsche Edelstahlwerke GmbH by using the numerical casting simulation software MAGMASOFT ® . In this paper some results extracted from the simulation software are shown and compared to experimental investigations.

  4. Solidification Segregation and Homogenization Behavior of 1Cr-1.25Mo-0.25V Steel Ingot

    Energy Technology Data Exchange (ETDEWEB)

    Kim, Dong-Bae [Dae-gu Mechatronics and Materials Institute, Daegu (Korea, Republic of); Na, Young-Sang; Seo, Seong-Moon [Korea Institute of Materials Science, Changwon (Korea, Republic of); Lee, Je-Hyun [Changwon National University, Changwon (Korea, Republic of)

    2016-09-15

    As a first step to optimizing the homogenization heat treatment following high temperature upset forging, the solidification segregation and the homogenization behaviors of solute elements were quantitatively analyzed for 1Cr-1.25Mo-0.25V steel ingot by electron probe micro-analysis (EPMA). The random sampling approach, which was designed to generate continuous compositional profiles of each solute element, was employed to clarify the segregation and homogenization behaviors. In addition, ingot castings of lab-scale and a 16-ton-sized 1Cr-1.25Mo-0.25V steel were simulated using the finite element method in three dimensions to understand the size effect of the ingot on the microsegregation and its reduction during the homogenization heat treatment. It was found that the microsegregation in a large-sized ingot was significantly reduced by the promotion of solid state diffusion due to the extremely low cooling rate. On the other hand, from the homogenization point of view, increasing the ingot size causes a dramatic increase in the dendrite arm spacing, and hence the homogenization of microsegregation in a large-sized ingot appears to be practically difficult.

  5. Development of the external cooling device of increase the productivity of neutron-transmutation-doped silicon semiconductor (NTD-Si) (Joint research)

    International Nuclear Information System (INIS)

    Hirose, Akira; Wada, Shigeru; Sasajima, Fumio; Kusunoki, Tsuyoshi; Kameyama, Iwao; Aizawa, Ryouji; Kikuchi, Naoyuki

    2007-01-01

    Neutron-Transmutation-Doped Silicon Semiconductor (hereinafter referred as 'NTD-Si') is the best semiconductor for the power device. The needs of NTD-Si increase recently in proportion to the popularization of hybrid-cars. A fission research reactor, which is a steady state neutron source, is being expected as the best device to meet the needs. So far, we have reconsidered the existing approach which is employed for NTD-Si production works at the research reactors JRR-3, JRR-4 and JMTR of JAEA so as to meet the needs. As one of the effective measures, we found out that the productivity can be increased by incorporating a new device to cool down radioactivity of irradiated silicon ingots at the place outside the main stream from the loading of silicon ingots to the withdrawal of irradiated ingots to the existing JRR-3 Uniformity Irradiation System. Consequently, we developed and installed the device (hereinafter referred as 'external cooling device'). After an ingot was irradiated once, it is turned over manually and irradiated again in order to irradiate the ingot uniformly. With the conventional system, it was necessary to wait the radioactivity of ingot decrease less than the permissible level with holding the ingot in the irradiation equipment. It was effective to shorten the waiting period by using an external cooling device for production increase of NTD-Si. It is expected that the productivity of NTD-Si will be increased by using the external cooling device. This report mentions the design of the external cooling device and verification between its design specifications and the performance of the device completed. (author)

  6. Development of low-cost silicon crystal growth techniques for terrestrial photovoltaic solar energy conversion

    Science.gov (United States)

    Zoutendyk, J. A.

    1976-01-01

    Because of the growing need for new sources of electrical energy, photovoltaic solar energy conversion is being developed. Photovoltaic devices are now being produced mainly from silicon wafers obtained from the slicing and polishing of cylindrically shaped single crystal ingots. Inherently high-cost processes now being used must either be eliminated or modified to provide low-cost crystalline silicon. Basic to this pursuit is the development of new or modified methods of crystal growth and, if necessary, crystal cutting. If silicon could be grown in a form requiring no cutting, a significant cost saving would potentially be realized. Therefore, several techniques for growth in the form of ribbons or sheets are being explored. In addition, novel techniques for low-cost ingot growth and cutting are under investigation.

  7. Preventing light-induced degradation in multicrystalline silicon

    Science.gov (United States)

    Lindroos, J.; Boulfrad, Y.; Yli-Koski, M.; Savin, H.

    2014-04-01

    Multicrystalline silicon (mc-Si) is currently dominating the silicon solar cell market due to low ingot costs, but its efficiency is limited by transition metals, extended defects, and light-induced degradation (LID). LID is traditionally associated with a boron-oxygen complex, but the origin of the degradation in the top of the commercial mc-Si brick is revealed to be interstitial copper. We demonstrate that both a large negative corona charge and an aluminum oxide thin film with a built-in negative charge decrease the interstitial copper concentration in the bulk, preventing LID in mc-Si.

  8. Aerosol-assisted extraction of silicon nanoparticles from wafer slicing waste for lithium ion batteries.

    Science.gov (United States)

    Jang, Hee Dong; Kim, Hyekyoung; Chang, Hankwon; Kim, Jiwoong; Roh, Kee Min; Choi, Ji-Hyuk; Cho, Bong-Gyoo; Park, Eunjun; Kim, Hansu; Luo, Jiayan; Huang, Jiaxing

    2015-03-30

    A large amount of silicon debris particles are generated during the slicing of silicon ingots into thin wafers for the fabrication of integrated-circuit chips and solar cells. This results in a significant loss of valuable materials at about 40% of the mass of ingots. In addition, a hazardous silicon sludge waste is produced containing largely debris of silicon, and silicon carbide, which is a common cutting material on the slicing saw. Efforts in material recovery from the sludge and recycling have been largely directed towards converting silicon or silicon carbide into other chemicals. Here, we report an aerosol-assisted method to extract silicon nanoparticles from such sludge wastes and their use in lithium ion battery applications. Using an ultrasonic spray-drying method, silicon nanoparticles can be directly recovered from the mixture with high efficiency and high purity for making lithium ion battery anode. The work here demonstrated a relatively low cost approach to turn wafer slicing wastes into much higher value-added materials for energy applications, which also helps to increase the sustainability of semiconductor material and device manufacturing.

  9. Application of hydrogen-plasma technology for property modification of silicon and producing the silicon-based structures

    International Nuclear Information System (INIS)

    Fedotov, A.K.; Mazanik, A.V.; Ul'yashin, A.G.; Dzhob, R; Farner, V.R.

    2000-01-01

    Effects of atomic hydrogen on the properties of Czochralski-grown single crystal silicon as well as polycrystalline shaped silicon have been investigated. It was established that the buried defect layers created by high-energy hydrogen or helium ion implantation act as a good getter centers for hydrogen atoms introduced in silicon in the process of hydrogen plasma hydrogenation. Atomic hydrogen was shown to be active as a catalyzer significantly enhancing the rate of thermal donors formation in p-type single crystal silicon. This effect can be used for n-p- and p-n-p-silicon based device structures producing [ru

  10. Nickel-induced crystallization of amorphous silicon

    Energy Technology Data Exchange (ETDEWEB)

    Schmidt, J A; Arce, R D; Buitrago, R H [INTEC (CONICET-UNL), Gueemes 3450, S3000GLN Santa Fe (Argentina); Budini, N; Rinaldi, P, E-mail: jschmidt@intec.unl.edu.a [FIQ - UNL, Santiago del Estero 2829, S3000AOM Santa Fe (Argentina)

    2009-05-01

    The nickel-induced crystallization of hydrogenated amorphous silicon (a-Si:H) is used to obtain large grained polycrystalline silicon thin films on glass substrates. a-Si:H is deposited by plasma enhanced chemical vapour deposition at 200 deg. C, preparing intrinsic and slightly p-doped samples. Each sample was divided in several pieces, over which increasing Ni concentrations were sputtered. Two crystallization methods are compared, conventional furnace annealing (CFA) and rapid thermal annealing (RTA). The crystallization was followed by optical microscopy and scanning electron microscopy observations, X-ray diffraction, and reflectance measurements in the UV region. The large grain sizes obtained - larger than 100{mu}m for the samples crystallized by CFA - are very encouraging for the preparation of low-cost thin film polycrystalline silicon solar cells.

  11. Modeling and Optimization of Direct Chill Casting to Reduce Ingot Cracking

    Energy Technology Data Exchange (ETDEWEB)

    Das, S.K.; Ningileri, S.; Long, Z.; Saito, K.; Khraisheh, M.; Hassan, M.H.; Kuwana, K.; Han, Q.; Viswanathan, S.; Sabau, A.S.; Clark, J.; Hyrn, J. (ANL)

    2006-08-15

    Approximately 68% of the aluminum produced in the United States is first cast into ingots prior to further processing into sheet, plate, extrusions, or foil. The direct chill (DC) semi-continuous casting process has been the mainstay of the aluminum industry for the production of ingots due largely to its robust nature and relative simplicity. Though the basic process of DC casting is in principle straightforward, the interaction of process parameters with heat extraction, microstructural evolution, and development of solidification stresses is too complex to analyze by intuition or practical experience. One issue in DC casting is the formation of stress cracks [1-15]. In particular, the move toward larger ingot cross-sections, the use of higher casting speeds, and an ever-increasing array of mold technologies have increased industry efficiencies but have made it more difficult to predict the occurrence of stress crack defects. The Aluminum Industry Technology Roadmap [16] has recognized the challenges inherent in the DC casting process and the control of stress cracks and selected the development of 'fundamental information on solidification of alloys to predict microstructure, surface properties, and stresses and strains' as a high-priority research need, and the 'lack of understanding of mechanisms of cracking as a function of alloy' and 'insufficient understanding of the aluminum solidification process', which is 'difficult to model', as technology barriers in aluminum casting processes. The goal of this Aluminum Industry of the Future (IOF) project was to assist the aluminum industry in reducing the incidence of stress cracks from the current level of 5% to 2%. Decreasing stress crack incidence is important for improving product quality and consistency as well as for saving resources and energy, since considerable amounts of cast metal could be saved by eliminating ingot cracking, by reducing the scalping thickness of

  12. Weak antilocalization and low-temperature characterization of sputtered polycrystalline bismuth selenide

    Science.gov (United States)

    Sahu, Protyush; Chen, Jun-Yang; Myers, Jason C.; Wang, Jian-Ping

    2018-03-01

    We report a thorough crystal and transport characterization of sputtered polycrystalline BixSe1 -x (20 nm), grown on a thermally oxidized silicon substrate. The crystal and grain structures of the sample are characterized by transmission electron microscopy. Selected-area electron diffraction shows a highly polycrystalline structure. Transport measurements suggest semiconducting behavior of the BixSe1 -x film with a very high carrier concentration (˜1020 cm3) and low mobility [˜8 cm2/(V s)]. High-field magnetoresistance measurements reveal weak antilocalization, to which both the low mobility and the angular dependence suggest an impurity-dominated contribution. Fitting parameters are obtained from 2D magnetoconductivity using the Hikami-Larkin-Nagaoka equation. The variation of the phase coherence length with temperature suggests electron-electron scattering for phase decoherence. Electron-electron interaction theory is used to analyze the low-temperature conductivity.

  13. Fast determination of impurities in metallurgical grade silicon for photovoltaics by instrumental neutron activation analysis

    International Nuclear Information System (INIS)

    Hampel, J.; Boldt, F.M.; Gerstenberg, H.; Hampel, G.; Kratz, J.V.; Reber, S.; Wiehl, N.

    2011-01-01

    Standard wafer solar cells are made of near-semiconductor quality silicon. This high quality material makes up a significant part of the total costs of a solar module. Therefore, new concepts with less expensive so called solar grade silicon directly based on physiochemically upgraded metallurgical grade silicon are investigated. Metallurgical grade silicon contains large amounts of impurities, mainly transition metals like Fe, Cr, Mn, and Co, which degrade the minority carrier lifetime and thus the solar cell efficiency. A major reduction of the transition metal content occurs during the unidirectional crystallization due to the low segregation coefficient between the solid and liquid phase. A further reduction of the impurity level has to be done by gettering procedures applied to the silicon wafers. The efficiency of such cleaning procedures of metallurgical grade silicon is studied by instrumental neutron activation analysis (INAA). Small sized silicon wafers of approximately 200 mg with and without gettering step were analyzed. To accelerate the detection of transition metals in a crystallized silicon ingot, experiments of scanning whole vertical silicon columns with a diameter of approximately 1 cm by gamma spectroscopy were carried out. It was demonstrated that impurity profiles can be obtained in a comparably short time. Relatively constant transition metal ratios were found throughout an entire silicon ingot. This led to the conclusion that the determination of several metal profiles might be possible by the detection of only one 'leading element'. As the determination of Mn in silicon can be done quite fast compared to elements like Fe, Cr, and Co, it could be used as a rough marker for the overall metal concentration level. Thus, a fast way to determine impurities in photovoltaic silicon material is demonstrated. - Highlights: → We demonstrate a fast way to determine impurities in photovoltaic silicon by NAA. → We make first experiments of locally

  14. Polycrystalline CVD diamond device level modeling for particle detection applications

    Science.gov (United States)

    Morozzi, A.; Passeri, D.; Kanxheri, K.; Servoli, L.; Lagomarsino, S.; Sciortino, S.

    2016-12-01

    Diamond is a promising material whose excellent physical properties foster its use for radiation detection applications, in particular in those hostile operating environments where the silicon-based detectors behavior is limited due to the high radiation fluence. Within this framework, the application of Technology Computer Aided Design (TCAD) simulation tools is highly envisaged for the study, the optimization and the predictive analysis of sensing devices. Since the novelty of using diamond in electronics, this material is not included in the library of commercial, state-of-the-art TCAD software tools. In this work, we propose the development, the application and the validation of numerical models to simulate the electrical behavior of polycrystalline (pc)CVD diamond conceived for diamond sensors for particle detection. The model focuses on the characterization of a physically-based pcCVD diamond bandgap taking into account deep-level defects acting as recombination centers and/or trap states. While a definite picture of the polycrystalline diamond band-gap is still debated, the effect of the main parameters (e.g. trap densities, capture cross-sections, etc.) can be deeply investigated thanks to the simulated approach. The charge collection efficiency due to β -particle irradiation of diamond materials provided by different vendors and with different electrode configurations has been selected as figure of merit for the model validation. The good agreement between measurements and simulation findings, keeping the traps density as the only one fitting parameter, assesses the suitability of the TCAD modeling approach as a predictive tool for the design and the optimization of diamond-based radiation detectors.

  15. Polycrystalline CVD diamond device level modeling for particle detection applications

    International Nuclear Information System (INIS)

    Morozzi, A.; Passeri, D.; Kanxheri, K.; Servoli, L.; Lagomarsino, S.; Sciortino, S.

    2016-01-01

    Diamond is a promising material whose excellent physical properties foster its use for radiation detection applications, in particular in those hostile operating environments where the silicon-based detectors behavior is limited due to the high radiation fluence. Within this framework, the application of Technology Computer Aided Design (TCAD) simulation tools is highly envisaged for the study, the optimization and the predictive analysis of sensing devices. Since the novelty of using diamond in electronics, this material is not included in the library of commercial, state-of-the-art TCAD software tools. In this work, we propose the development, the application and the validation of numerical models to simulate the electrical behavior of polycrystalline (pc)CVD diamond conceived for diamond sensors for particle detection. The model focuses on the characterization of a physically-based pcCVD diamond bandgap taking into account deep-level defects acting as recombination centers and/or trap states. While a definite picture of the polycrystalline diamond band-gap is still debated, the effect of the main parameters (e.g. trap densities, capture cross-sections, etc.) can be deeply investigated thanks to the simulated approach. The charge collection efficiency due to β -particle irradiation of diamond materials provided by different vendors and with different electrode configurations has been selected as figure of merit for the model validation. The good agreement between measurements and simulation findings, keeping the traps density as the only one fitting parameter, assesses the suitability of the TCAD modeling approach as a predictive tool for the design and the optimization of diamond-based radiation detectors.

  16. Silicone metalization

    Energy Technology Data Exchange (ETDEWEB)

    Maghribi, Mariam N. (Livermore, CA); Krulevitch, Peter (Pleasanton, CA); Hamilton, Julie (Tracy, CA)

    2008-12-09

    A system for providing metal features on silicone comprising providing a silicone layer on a matrix and providing a metal layer on the silicone layer. An electronic apparatus can be produced by the system. The electronic apparatus comprises a silicone body and metal features on the silicone body that provide an electronic device.

  17. Development and pilot production of three ingot-source beryllium sheet metal parts

    International Nuclear Information System (INIS)

    Floyd, D.R.

    1975-01-01

    Results of an extensive development program aimed at making three, separate, structural components from beryllium, using sheet-metal fabrication methods, are presented. Ingot-source beryllium sheet at thicknesses of 0.100, 0.125, and 0.170 inch is formed in a fully-recrystallized and in a partially-recrystallized condition. The tensile yield strength is 26,000 psi after full recrystallization. After partial recrystallization, tensile yield strength is between 35,000 and 45,000 psi, depending upon sheet thickness, heat treat temperature, and time at temperature. The high yield strength is retained in the parts after forming. (U.S.)

  18. Energy-efficiency in inductive heating of forging ingots; Energieeffizienz bei der induktiven Erwaermung von Schmiedebloecken

    Energy Technology Data Exchange (ETDEWEB)

    Padberg, Michael; Doetsch, Erwin [ABP Induction Systems, Dortmund (Germany)

    2012-03-15

    The continuously increasing importance of the CO{sub 2} balance and of conservation of resources is resulting in ever greater demands for high energy-efficiency in the process used for heating of forging ingots. Plant and process engineering play roles of parallel significance in the fulfillment of these requirements, and this article focuses on both in equal degree. The shares of the individual components in the overall energy consumption of an induction heating installation are therefore firstly determined, and their respective potentials for optimization then discussed. The quality of the heating process itself, and its optimum design for reduction of energy consumption, are then examined. (orig.)

  19. Optimization of hybrid-type instrumentation for Pu accountancy of U/TRU ingot in pyroprocessing.

    Science.gov (United States)

    Seo, Hee; Won, Byung-Hee; Ahn, Seong-Kyu; Lee, Seung Kyu; Park, Se-Hwan; Park, Geun-Il; Menlove, Spencer H

    2016-02-01

    One of the final products of pyroprocessing for spent nuclear fuel recycling is a U/TRU ingot consisting of rare earth (RE), uranium (U), and transuranic (TRU) elements. The amounts of nuclear materials in a U/TRU ingot must be measured as precisely as possible in order to secure the safeguardability of a pyroprocessing facility, as it contains the most amount of Pu among spent nuclear fuels. In this paper, we propose a new nuclear material accountancy method for measurement of Pu mass in a U/TRU ingot. This is a hybrid system combining two techniques, based on measurement of neutrons from both (1) fast- and (2) thermal-neutron-induced fission events. In technique #1, the change in the average neutron energy is a signature that is determined using the so-called ring ratio method, according to which two detector rings are positioned close to and far from the sample, respectively, to measure the increase of the average neutron energy due to the increased number of fast-neutron-induced fission events and, in turn, the Pu mass in the ingot. We call this technique, fast-neutron energy multiplication (FNEM). In technique #2, which is well known as Passive Neutron Albedo Reactivity (PNAR), a neutron population's changes resulting from thermal-neutron-induced fission events due to the presence or absence of a cadmium (Cd) liner in the sample's cavity wall, and reflected in the Cd ratio, is the signature that is measured. In the present study, it was considered that the use of a hybrid, FNEM×PNAR technique would significantly enhance the signature of a Pu mass. Therefore, the performance of such a system was investigated for different detector parameters in order to determine the optimal geometry. The performance was additionally evaluated by MCNP6 Monte Carlo simulations for different U/TRU compositions reflecting different burnups (BU), initial enrichments (IE), and cooling times (CT) to estimate its performance in real situations. Copyright © 2015 Elsevier Ltd. All

  20. Extremal Overall Elastic Response of Polycrystalline Materials

    DEFF Research Database (Denmark)

    Bendsøe, Martin P; Lipton, Robert

    1997-01-01

    Polycrystalline materials comprised of grains obtained from a single anisotropic material are considered in the framework of linear elasticity. No assumptions on the symmetry of the polycrystal are made. We subject the material to independent external strain and stress fields with prescribed mean...

  1. Silicon Solar Cell Process Development, Fabrication and Analysis, Phase 1

    Science.gov (United States)

    Yoo, H. I.; Iles, P. A.; Tanner, D. P.

    1979-01-01

    Solar cells from RTR ribbons, EFG (RF and RH) ribbons, dendritic webs, Silso wafers, cast silicon by HEM, silicon on ceramic, and continuous Czochralski ingots were fabricated using a standard process typical of those used currently in the silicon solar cell industry. Back surface field (BSF) processing and other process modifications were included to give preliminary indications of possible improved performance. The parameters measured included open circuit voltage, short circuit current, curve fill factor, and conversion efficiency (all taken under AM0 illumination). Also measured for typical cells were spectral response, dark I-V characteristics, minority carrier diffusion length, and photoresponse by fine light spot scanning. the results were compared to the properties of cells made from conventional single crystalline Czochralski silicon with an emphasis on statistical evaluation. Limited efforts were made to identify growth defects which will influence solar cell performance.

  2. Solar cell fabricated on welded thin flexible silicon

    Directory of Open Access Journals (Sweden)

    Hessmann Maik Thomas

    2015-01-01

    Full Text Available We present a thin-film crystalline silicon solar cell with an AM1.5 efficiency of 11.5% fabricated on welded 50 μm thin silicon foils. The aperture area of the cell is 1.00 cm2. The cell has an open-circuit voltage of 570 mV, a short-circuit current density of 29.9 mA cm-2 and a fill factor of 67.6%. These are the first results ever presented for solar cells on welded silicon foils. The foils were welded together in order to create the first thin flexible monocrystalline band substrate. A flexible band substrate offers the possibility to overcome the area restriction of ingot-based monocrystalline silicon wafers and the feasibility of a roll-to-roll manufacturing. In combination with an epitaxial and layer transfer process a decrease in production costs can be achieved.

  3. Development of low cost silicon solar cells by reusing the silicon saw dust collected during wafering process

    International Nuclear Information System (INIS)

    Zaidi, Z.I.; Raza, B.; Ahmed, M.; Sheikh, H.; Qazi, I.A.

    2002-01-01

    Silicon material due to its abundance in nature and maximum conversion efficiency has been successfully being used for the fabrication of electronic and photovoltaic devices such as ICs, diodes, transistors and solar cells. The 80% of the semiconductor industry is ruled by silicon material. Single crystal silicon solar cells are in use for both space and terrestrial application, due to the well developed technology and better efficiency than polycrystalline and amorphous silicon solar cells. The current research work is an attempt to reduce the cost of single crystal silicon solar cells by reusing the silicon saw dust obtained during the watering process. During the watering process about 45% Si material is wasted in the form of Si powder dust. Various waste powder silicon samples were analyzed using inductively Coupled Plasma (ICP) technique, for metallic impurities critical for solar grade silicon material. The results were evaluated from impurity and cost point of view. (author)

  4. Effects of the ingot phase transition on microstructure and magnetic properties of CeNdFeB melt-spun ribbons

    Energy Technology Data Exchange (ETDEWEB)

    Wang, Xuchao [Division of Functional Materials Research, Central Iron and Steel Research Institute, Beijing 100081, China (China); College of Sciences, Northeastern University, Shenyang 110819 (China); Zhu, Minggang, E-mail: mgzhu@126.com [Division of Functional Materials Research, Central Iron and Steel Research Institute, Beijing 100081, China (China); Li, Wei; Zheng, Liyun; Guo, Zhaohui; Du, Xiao [Division of Functional Materials Research, Central Iron and Steel Research Institute, Beijing 100081, China (China); Du, An [College of Sciences, Northeastern University, Shenyang 110819 (China)

    2015-11-01

    The paper studies the phase transition of ingot with the composition (Ce{sub 50}Nd{sub 50}){sub 30}Fe{sub bal}Co{sub 4}Ga{sub 0.2}B{sub 0.92} after the annealing treatment at 1050 °C. The melt-spun ribbons which is prepared by the two treatment status ingots. The phase structure and microstructure morphologies of the ingots and melt-spun ribbons were analysed and observed by XRD and SEM. It was found that the grain size of the ribbons is on the nanometer scale. The EDS results show that there are four different phases in the ingot: (CeNd){sub 2}Fe{sub 14}B, α-Fe, Ce-rich phase and Nd-rich phase. After the annealing treatment, α-Fe, Ce-rich phase, and Nd-rich phase were obviously reduced and the contents of the main phase was significantly increased in the annealed ingot compared with the unanneal treatment ingot. The VSM results show that there is a peak waist in the ribbon which is prepared by the untreated ingot. Because the ingot is uneven, the ribbons may have the secondary phase, the Hcj is 8394 Oe. But the demagnetization curves of the ribbons, which is prepared by the annealed ingot, is relatively smooth and without the soft magnetic phase and the Hcj is 12,528 Oe, which is higher than the unanneal treatment ingot. We can know that the ingot with fine organization is the key factors to preparing high-performance ribbons.

  5. Effect of vacuum arc melting/casting parameters on shrinkage cavity/piping of austenitic stainless steel ingot

    International Nuclear Information System (INIS)

    Kamran, J.; Feroz, M.; Sarwar, M.

    2009-01-01

    Shrinkage cavity/piping at the end of the solidified ingot of steels is one of the most common casting problem in 316L austenitic stainless steel ingot, when consumable electrode is melted and cast in a water-cooled copper mould by vacuum arc re-melting furnace. In present study an effort has been made to reduce the size of shrinkage cavity/ piping by establishing the optimum value of hot topping process parameters at the end of the melting process. It is concluded that the shrinkage cavity/piping at the top of the solidified ingot can be reduced to minimum by adjusting the process parameters particularly the melting current density. (author)

  6. Controlling liquid pool depth in VAR of a 21.6 cm diameter ingot of Alloy 718

    Science.gov (United States)

    Lopez, Felipe; Beaman, Joseph; Williamson, Rodney; Taleff, Eric; Watt, Trevor

    It is believed that the final microstructure in vacuum arc remelted (VAR) ingots is strongly influenced by the molten metal pool profile. Thus, if the pool profile was properly controlled during the melt then defect-free microstructures would be obtained. The recent development of a reduced-order model of VAR solidification allowed the design of a pool depth controller to accomplish this task. The controller used a linear quadratic regulator and a Kalman filter to stabilize the melt pool solidification front under the effect of uncertain process dynamics and noisy measurements. Basic Axisymmetric Remelting (BAR), a high-fidelity VAR ingot model, was used in real time to provide pool depth measurements that were incorporated in the control loop. The controller was tested at Los Alamos National Laboratory in a 21.6 diameter Alloy 718 ingot. Details of the controller design will be presented, along with comparisons to experimentally-measured pool depths.

  7. Thin film polycrystalline Si solar cells studied in transient regime by optical pump-terahertz probe spectroscopy

    Czech Academy of Sciences Publication Activity Database

    Pikna, Peter; Skoromets, Volodymyr; Becker, C.; Fejfar, Antonín; Kužel, Petr

    2015-01-01

    Roč. 107, č. 23 (2015), "233901-1"-"233901-5" ISSN 0003-6951 R&D Projects: GA ČR GA13-12386S Grant - others:AVČR(CZ) M100101216 Institutional support: RVO:68378271 Keywords : thin film polycrystalline silicon * terahertz spectroscopy * passivation * Suns-Voc method * defects Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 3.142, year: 2015

  8. A MONTÉ CARLO MODEL FOR SIMULATING THE NITROGEN DIFFUSION EFFECT INTO B-LPCVD-NIDOS POLYCRYSTALLINE THIN FILMS

    OpenAIRE

    S ALLAG; S MERABET; M BOUKEZZATA

    2012-01-01

    The principal objective of our current work, is to study the influence of different treatment from surface which makes it possible to improve the properties of materials by technique of beam of ions (diffusion – implantation), on the distribution of the particles in a semiconductor the prone polycrystalline Silicon of our study, largely used in micro-electronics.  The interest of this study is related to the ceaseless requirements in industry for increasingly reduced, powerful materials and w...

  9. Fabrication of a 1200 kg Ingot of V-4Cr-4Ti for the DIII-D Radiative Divertor Program

    International Nuclear Information System (INIS)

    Johnson, W.R.; Smith, J.P.

    1998-01-01

    Vanadium chromium titanium alloys are attractive materials for fusion reactors because of their high temperature capability and their potential for low neutron active and rapid activation decay. A V-4Cr-4Ti alloy has been selected in the U.S. as the current leading candidate vanadium alloy for future use in fusion reactor structural applications. General Atomics (GA), in conjunction with the Department of Energy's (DOE) DIII-D Program, is carrying out a plan for the utilization of this vanadium alloy in the DIII-D tokamak. The plan will culminate in the fabrication, installation, and operation of a V-4Ti alloy structure in the DIII-D Radiative Divertor (RD) upgrade. The deployment of vanadium alloy will provide a meaningful step in the development and technology acceptance of this advanced material for future fusion power devices. Under a GA contract and material specification, an industrial scale 1200 kg heat (ingot) of a V-4Cr-4Ti alloy has been produced and converted into product forms by Wah Chang of Albany, Oregon (WCA). To assure the proper control of minor and trace impurities which affect the mechanical and activation behavior of this vanadium alloy, selected lots of raw vanadium base metal were processed by aluminothermic reduction of high purity vanadium oxide, and were then electron beam melted into two high purity vanadium ingots. The ingots were then consolidated with high purity Cr and Ti, and double vacuum-arc melted to obtain a 1200 kg V-4Cr-4Ti alloy ingot. Several billets were extruded from the ingot, and were then fabricated into plate, sheet, and rod at WCA. Tubing was subsequently processed from plate material. The chemistry and fabrication procedures for the product forms were specified on the basis of experience and knowledge gained from DOE Fusion Materials Program studies on previous laboratory scale heats and a large scale ingot (500 kg)

  10. Numerical simulation on multiple pouring process for a 292 t steel ingot

    Directory of Open Access Journals (Sweden)

    Tu Wutao

    2014-01-01

    Full Text Available A ladle-tundish-mould transportation model considering the entire multiple pouring (MP process is proposed. Numerical simulation is carried out to study the carbon distribution and variation in both the tundish and the mould for making a 292 t steel ingot. Firstly, the fluid flow as well as the heat and mass transfer of the molten steel in the tundish is simulated based on the multiphase transient turbulence model. Then, the carbon mixing in the mould is calculated by using the species concentration at the tundish outlet as the inlet condition during the teeming process. The results show a high concentration of carbon at the bottom and a low concentration of carbon at the top of the mould after a MP process with carbon content high in the first ladle and low in the last ladle. Such carbon concentration distribution would help reduce the negative segregation at the bottom and the positive segregation at the top of the solidified ingot.

  11. On the cooling rate of strip cast ingots for sintered NdFeB magnets

    Energy Technology Data Exchange (ETDEWEB)

    Yu, L.Q. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China); Yan, M. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China)]. E-mail: mse_yanmi@dial.zju.edu.cn; Wu, J.M. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China); Luo, W. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China); Cui, X.G. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China); Ying, H.G. [State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027 (China)

    2007-04-30

    Effects of the cooling rate of strip cast ingots on magnetic properties of sintered NdFeB magnets were studied. It is found that the magnetic properties greatly depend on wheel speed due to different alloy microstructures, which affect readily the particle size distribution of powders obtained after the subsequent jet milling. At higher cooling rate, interlamellar spacing between Nd-rich platelets of the alloy was small, resulting in a lower saturated magnetization due to increased amounts of small particles after jet milling. With further decreasing cooling rate, the resultant larger interlamellar spacing led to too large particle sizes as well as a more irregular shape; thus deteriorated the magnetic properties of the final magnet. A model was developed to disclose the effects of particle sizes on the magnetic alignment process. In the current investigation, optimum magnetic properties of the final magnets were obtained with a cooling rate of 2.6 m/s for preparing the strip. The magnets made by conventionally cast ingot technique exhibited the lowest magnetic properties because of the slowest cooling rate.

  12. Review of ingot niobium as a material for superconducting radiofrequency accelerating cavities

    Energy Technology Data Exchange (ETDEWEB)

    Kneisel, P., E-mail: kneisel@jlab.org [Jefferson Lab, Newport News, VA 23606 (United States); Ciovati, G.; Dhakal, P. [Jefferson Lab, Newport News, VA 23606 (United States); Saito, K. [Michigan State University, East Lansing, MI 48824 (United States); Singer, W.; Singer, X. [DESY, Notkestrasse 85, D-22607 Hamburg (Germany); Myneni, G.R., E-mail: rao@jlab.org [Jefferson Lab, Newport News, VA 23606 (United States)

    2015-02-21

    As a result of collaboration between Jefferson Lab and niobium manufacturer Companhia Brasileira de Metalurgia e Mineração (CBMM), ingot niobium was explored as a possible material for superconducting radiofrequency (SRF) cavity fabrication. The first single cell cavity from large-grain high purity niobium was fabricated and successfully tested at Jefferson Lab in 2004. This work triggered research activities in other SRF laboratories around the world. Large-grain (LG) niobium became not only an interesting alternative material for cavity builders, but also material scientists and surface scientists were eager to participate in the development of this technology. Many single cell cavities made from material of different suppliers have been tested successfully and several multi-cell cavities have shown performances comparable to the best cavities made from standard fine-grain niobium. Several 9-cell cavities fabricated by Research Instruments and tested at DESY exceeded the best performing fine grain cavities with a record accelerating gradient of E{sub acc}=45.6 MV/m. The quality factor of those cavities was also higher than that of fine-grain (FG) cavities processed with the same methods. Such performance levels push the state-of-the art of SRF technology and are of great interest for future accelerators. This contribution reviews the development of ingot niobium technology and highlights some of the differences compared to standard FG material and opportunities for further developments.

  13. Attenuation of Thermal Neutrons by Crystalline Silicon

    International Nuclear Information System (INIS)

    Adib, M.; Habib, N.; Ashry, A.; Fathalla, M.

    2002-01-01

    A simple formula is given which allows to calculate the contribution of the total neutron cross - section including the Bragg scattering from different (hkt) planes to the neutron * transmission through a solid crystalline silicon. The formula takes into account the silicon form of poly or mono crystals and its parameters. A computer program DSIC was developed to provide the required calculations. The calculated values of the total neutron cross-section of perfect silicon crystal at room and liquid nitrogen temperatures were compared with the experimental ones. The obtained agreement shows that the simple formula fits the experimental data with sufficient accuracy .A good agreement was also obtained between the calculated and measured values of polycrystalline silicon in the energy range from 5 eV to 500μ eV. The feasibility study on using a poly-crystalline silicon as a cold neutron filter and mono-crystalline as a thermal neutron one is given. The optimum crystal thickness, mosaic spread, temperature and cutting plane for efficiently transmitting the thermal reactor neutrons, while rejecting both fast neutrons and gamma rays accompanying the thermal ones for the mono crystalline silicon are also given

  14. Amorphous-polycrystal transition induced by laser pulse in self-ion implanted silicon

    International Nuclear Information System (INIS)

    Foti, G.; Rimini, E.; Vitali, G.; Bertolotti, M.

    1977-01-01

    Reflection high energy electron diffraction has been used to investigate the amorphous to polycrystalline structure transition in silicon induced by laser pulse. The power density of the ruby laser pulse, in the free generation mode, has been maintained below the threshold to induce surface damage. Depth analysis has been carried out in silicon crystal using the channeling effect technique. (orig.) [de

  15. Photoluminescence of polycrystalline CuIn 0.5 Ga 0.5 Te 2 thin films grown by flash evaporation

    KAUST Repository

    Yandjah, L.

    2018-04-03

    Polycrystalline CuIn0.5Ga0.5Te2 films were deposited by flash evaporation from ingot prepared by reacting, in stoichiometric proportions, high purity Cu, In, Ga and Te elements in vacuum sealed quartz . The as-obtained films were characterized by X – ray diffraction (XRD), transmission electron microscopy (TEM) combined with energy dispersive spectroscopy (EDS). XRD and TEM results showed that the layer has a chalcopyrite-type structure, predominantly oriented along (112) planes, with lattice parameters a = 0.61 nm and c = 1.22 nm. The optical properties in the near - infrared and visible range 600 - 2400 nm have been studied. The analysis of absorption coefficient yielded an energy gap value of 1.27 eV. Photoluminescence analysis of as-grown sample shows two main emission peaks located at 0.87 and 1.19 eV at 4 K.

  16. Method for producing polycrystalline boron nitride

    International Nuclear Information System (INIS)

    Alexeevskii, V.P.; Bochko, A.V.; Dzhamarov, S.S.; Karpinos, D.M.; Karyuk, G.G.; Kolomiets, I.P.; Kurdyumov, A.V.; Pivovarov, M.S.; Frantsevich, I.N.; Yarosh, V.V.

    1975-01-01

    A mixture containing less than 50 percent of graphite-like boron nitride treated by a shock wave and highly defective wurtzite-like boron nitride obtained by a shock-wave method is compressed and heated at pressure and temperature values corresponding to the region of the phase diagram for boron nitride defined by the graphite-like compact modifications of boron nitride equilibrium line and the cubic wurtzite-like boron nitride equilibrium line. The resulting crystals of boron nitride exhibit a structure of wurtzite-like boron nitride or of both wurtzite-like and cubic boron nitride. The resulting material exhibits higher plasticity as compared with polycrystalline cubic boron nitride. Tools made of this compact polycrystalline material have a longer service life under impact loads in machining hardened steel and chilled iron. (U.S.)

  17. Effective polycrystalline sensor of ultraviolet radiation

    Directory of Open Access Journals (Sweden)

    S.Yu. Pavelets

    2017-10-01

    Full Text Available Deposition of special thin layers with high and low resistance in space charge region of surface barrier photoconverters based on the p-Cu1.8S/n-CdS structure leads to a sufficient increase in photosensitivity and decrease in dark tunneling-recombination current. Highly efficient and stable polycrystalline photoconverters of ultraviolet radiation based on polycrystalline CdS have been obtained. Electrical and photoelectric properties have been investigated, and the main operational parameters of ultraviolet sensors have been adduced. The reasons for high stability of the parameters inherent to the p-Cu1.8S/n-CdS sensors are as follows: the absence of impurity components additionally doped to the barrier structure and stability of the photocurrent photoemission component.

  18. X-ray beam penetration in TXRF measurement of polycrystalline and amorphous surfaces

    International Nuclear Information System (INIS)

    Ghatak-Roy, A.R.; Hossain, T.Z.

    2000-01-01

    For TXRF measurement on single crystal silicon surface, it is generally agreed that the x-ray beam penetration is of the order of a few hundred Angstroms from the surface. However, for polycrystalline and amorphous surfaces - frequently used in semiconductor manufacturing there are evidences that x-rays penetrate much deeper revealing underlying layers. The evidences come from various measurements done with films such as silicon dioxide, silicon nitride and metal films such as aluminum, titanium and cobalt. A systematic study was carried out to help understand the issue further. Four sets of samples (on 8 inch wafers) were prepared to create layers buried under various deposited metal and non-metal layers. The metal layers created were aluminum, titanium and cobalt and the non-metal layers were silicon dioxide and silicon nitride. These samples were analyzed by TXRF under various angles and energies and the data were analyzed for signals from various buried layers along with their angular dependence. The results indicated deep penetration of x-ray beams. The samples were further analyzed by SIMS (Secondary Ion Mass Spectrometry) and some of them by ICP-MS (Inductively Coupled Plasma - Mass Spectrometry) to obtain information about their depth profiles. This was done in order to rule out the possibility of intermixing of layers during deposition. (author)

  19. Extremal Overall Elastic Response of Polycrystalline Materials

    DEFF Research Database (Denmark)

    Bendsøe, Martin P; Lipton, Robert

    1996-01-01

    Polycrystalline materials comprised of grains obtained froma single anisotropic material are considered in the frameworkof linear elasticity. No assumptions on the symmetry of thepolycrystal are made. We subject the material to independentexternal strain and stress fields with prescribed mean...... values.We show that the extremal overall elastic response is alwaysachieved by a configuration consisting of a single properlyoriented crystal. This result is compared to results for isotropicpolycrystals....

  20. Hydrogen solubility in polycrystalline - and nonocrystalline niobium

    International Nuclear Information System (INIS)

    Ishikawa, T.T.; Silva, J.R.G. da

    1981-01-01

    Hydrogen solubility in polycrystalline and monocrystalline niobium was measured in the range 400 0 C to 1000 0 C at one atmosphere hydrogen partial pressure. The experimental technique consists of saturation of the solvent metal with hydrogen, followed by quenching and analysis of the solid solution. It is presented solubility curves versus reciprocal of the absolute doping temperature, associated with their thermodynamical equation. (Author) [pt

  1. Towards solar grade silicon: Challenges and benefits for low cost photovoltaics

    Energy Technology Data Exchange (ETDEWEB)

    Pizzini, Sergio [Ned Silicon Spa, Via Th. Edison 6, 60027 Osimo (Ancona) (Italy)

    2010-09-15

    It is well known that silicon in its various structural configurations (single crystal, multicrystalline, amorphous, micro-nanocrystalline) supplies almost 90% of the substrates used in the photovoltaic industry. It is also known, since years, that the photovoltaic (PV) industry shows a marked growth trend, which demanded and demands a continuous, huge increase of the bulk silicon supply in the order of 30%/yr. In order to fulfill their today- and future needs, many companies worldwide took the decision to start the installation of many thousand tons/year plants, most of them using the Siemens process, some of them using the MG route, to produce the so called solar grade (SG) silicon. The advantages of the Siemens process are well known, as it provides ultrapure silicon, directly usable for growing either single crystalline Czochralski ingots or multicrystalline ingots using the directional solidification (DS) technique. The disadvantages are its high energetic cost (a minimum of 120 kWH/kg) and the possible losses of chlorinated gases in the atmosphere, with possible severe environmental problems. The advantages of the MG route are still potential, as there is no commercially available production of solar silicon as yet, and rely on its reduced energetic costs (a maximum of 25-30 kWh/kg) for a feedstock directly usable for growing multicrystalline ingots using the DS technique. The drawbacks of silicon of MG origin are its larger concentration of metallic impurities, as compared with the Siemens one, the higher B and P content, and the potentially high carbon content. The aim of this paper is to deal with some of the problems encountered so far with the silicon of MG origin with respect to the metallic and non-metallic impurities content, as well as to propose technologically feasible solar grade feedstock specifications. (author)

  2. Characterization of electrochemically modified polycrystalline platinum surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Krebs, L.C.; Ishida, Takanobu.

    1991-12-01

    The characterization of electrochemically modified polycrystalline platinum surfaces has been accomplished through the use of four major electrochemical techniques. These were chronoamperometry, chronopotentiommetry, cyclic voltammetry, and linear sweep voltammetry. A systematic study on the under-potential deposition of several transition metals has been performed. The most interesting of these were: Ag, Cu, Cd, and Pb. It was determined, by subjecting the platinum electrode surface to a single potential scan between {minus}0.24 and +1.25 V{sub SCE} while stirring the solution, that the electrocatalytic activity would be regenerated. As a consequence of this study, a much simpler method for producing ultra high purity water from acidic permanganate has been developed. This method results in water that surpasses the water produced by pyrocatalytic distillation. It has also been seen that the wettability of polycrystalline platinum surfaces is greatly dependent on the quantity of oxide present. Oxide-free platinum is hydrophobic and gives a contact angle in the range of 55 to 62 degrees. We have also modified polycrystalline platinum surface with the electrically conducting polymer poly-{rho}-phenylene. This polymer is very stable in dilute sulfuric acid solutions, even under applied oxidative potentials. It is also highly resistant to electrochemical hydrogenation. The wettability of the polymer modified platinum surface is severely dependent on the choice of supporting electrolyte chosen for the electrochemical polymerization. Tetraethylammonium tetrafluoroborate produces a film that is as hydrophobic as Teflon, whereas tetraethylammonium perchlorate produces a film that is more hydrophilic than oxide-free platinum.

  3. Characterization of electrochemically modified polycrystalline platinum surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Krebs, Leonard C. [State Univ. of New York (SUNY), Stony Brook, NY (United States); Ishida, Takanobu [State Univ. of New York (SUNY), Stony Brook, NY (United States)

    1991-12-01

    The characterization of electrochemically modified polycrystalline platinum surfaces has been accomplished through the use of four major electrochemical techniques. These were chronoamperometry, chronopotentiommetry, cyclic voltammetry, and linear sweep voltammetry. A systematic study on the under-potential deposition of several transition metals has been performed. The most interesting of these were: Ag, Cu, Cd, and Pb. It was determined, by subjecting the platinum electrode surface to a single potential scan between -0.24 and +1.25 VSCE while stirring the solution, that the electrocatalytic activity would be regenerated. As a consequence of this study, a much simpler method for producing ultra high purity water from acidic permanganate has been developed. This method results in water that surpasses the water produced by pyrocatalytic distillation. It has also been seen that the wettability of polycrystalline platinum surfaces is greatly dependent on the quantity of oxide present. Oxide-free platinum is hydrophobic and gives a contact angle in the range of 55 to 62 degrees. We have also modified polycrystalline platinum surface with the electrically conducting polymer poly-ρ-phenylene. This polymer is very stable in dilute sulfuric acid solutions, even under applied oxidative potentials. It is also highly resistant to electrochemical hydrogenation. The wettability of the polymer modified platinum surface is severely dependent on the choice of supporting electrolyte chosen for the electrochemical polymerization. Tetraethylammonium tetrafluoroborate produces a film that is as hydrophobic as Teflon, whereas tetraethylammonium perchlorate produces a film that is more hydrophilic than oxide-free platinum.

  4. Tracking performance of a single-crystal and a polycrystalline diamond pixel-detector

    Energy Technology Data Exchange (ETDEWEB)

    Menasce, D.; et al.

    2013-06-01

    We present a comparative characterization of the performance of a single-crystal and a polycrystalline diamond pixel-detector employing the standard CMS pixel readout chips. Measurements were carried out at the Fermilab Test Beam Facility, FTBF, using protons of momentum 120 GeV/c tracked by a high-resolution pixel telescope. Particular attention was directed to the study of the charge-collection, the charge-sharing among adjacent pixels and the achievable position resolution. The performance of the single-crystal detector was excellent and comparable to the best available silicon pixel-detectors. The measured average detection-efficiency was near unity, ε = 0.99860±0.00006, and the position-resolution for shared hits was about 6 μm. On the other hand, the performance of the polycrystalline detector was hampered by its lower charge collection distance and the readout chip threshold. A new readout chip, capable of operating at much lower threshold (around 1 ke$-$), would be required to fully exploit the potential performance of the polycrystalline diamond pixel-detector.

  5. Polycrystalline Si nanoparticles and their strong aging enhancement of blue photoluminescence

    Science.gov (United States)

    Yang, Shikuan; Cai, Weiping; Zeng, Haibo; Li, Zhigang

    2008-07-01

    Nearly spherical polycrystalline Si nanoparticles with 20 nm diameter were fabricated based on laser ablation of silicon wafer immersed in sodium dodecyl sulfate aqueous solution. Such Si nanoparticles consist of disordered areas and ultrafine grains of 3 nm in mean size and exhibit significant photoluminescence in blue region. Importantly, aging at ambient air leads to continuing enhancement of the emission (more than 130 times higher in 16 weeks) showing stable and strong blue emission. This aging enhancement is attributed to progressive passivation of nonradiative Pb centers corresponding to silicon dangling bonds on the particles' surface. This study could be helpful in pushing Si into optoelectronic field and Si-based full color display, biomedical tagging, and flash memories.

  6. Characteristics of the natural uranium ingots developed in IPEN - CNEN/SP

    International Nuclear Information System (INIS)

    Soares, M.C.B.; Koshimizu, S.

    1990-01-01

    The natural uranium consists of two primary isotopes, the U sup(235) (0,7%) and the U sup(238) (99,3%). The isotopic separation carried out in order to obtain enriched uranium, generates a by-product called depleted uranium, which can be applied for industrial uses. The most singular property, from engineering standpoint, is its high density. When the density is the only important factor, the uranium has great advantage over other heavy metals related to economic and technical considerations. Among some applications of uranium are aircraft and missile counterweights, kinetics energy penetrators, radiation shielding, gyro rotors and oil-well sinker bars. The uranium ingot fabrication is done by direct reduction of UF, with magnesium, without remelting. The microstructure of as-cast uranium is, as in the other as-cast, formed by coarse and. (author)

  7. Analysis and calculation of macrosegregation in a casting ingot, exhibits C and E

    Science.gov (United States)

    Poirier, D. R.; Maples, A. L.

    1984-01-01

    A computer model which describes the solidification of a binary metal alloy in an insulated rectangular mold with a temperature gradient is presented. A numerical technique, applicable to a broad class of moving boundary problems, was implemented therein. The solidification model described is used to calculate the macrosegregation within the solidified casting by coupling the equations for liquid flow in the solid/liquid or mushy zone with the energy equation for heat flow throughout the ingot and thermal convection in the bulk liquid portion. The rate of development of the solid can be automatically calculated by the model. Numerical analysis of such solidification parameters as enthalpy and boundary layer flow is displayed. On-line user interface and software documentation are presented.

  8. Positive segregation as a function of buoyancy force during steel ingot solidification

    International Nuclear Information System (INIS)

    Radovic, Zarko; Jaukovic, Nada; Lalovic, Milisav; Tadic, Nebojsa

    2008-01-01

    We analyze theoretically and experimentally solute redistribution in the dendritic solidification process and positive segregation during solidification of steel ingots. Positive segregation is mainly caused by liquid flow in the mushy zone. Changes in the liquid steel velocity are caused by the temperature gradient and by the increase in the solid fraction during solidification. The effects of buoyancy and of the change in the solid fraction on segregation intensity are analyzed. The relationships between the density change, liquid fraction and the steel composition are considered. Such elements as W, Ni, Mo and Cr decrease the effect of the density variations, i.e. they show smaller tendency to segregate. Based on the modeling and experimental results, coefficients are provided controlling the effects of chemical composition, secondary dendrite arm spacing and the solid fraction.

  9. Compositional analysis of silicon oxide/silicon nitride thin films

    Directory of Open Access Journals (Sweden)

    Meziani Samir

    2016-06-01

    Full Text Available Hydrogen, amorphous silicon nitride (SiNx:H abbreviated SiNx films were grown on multicrystalline silicon (mc-Si substrate by plasma enhanced chemical vapour deposition (PECVD in parallel configuration using NH3/SiH4 gas mixtures. The mc-Si wafers were taken from the same column of Si cast ingot. After the deposition process, the layers were oxidized (thermal oxidation in dry oxygen ambient environment at 950 °C to get oxide/nitride (ON structure. Secondary ion mass spectroscopy (SIMS, Rutherford backscattering spectroscopy (RBS, Auger electron spectroscopy (AES and energy dispersive X-ray analysis (EDX were employed for analyzing quantitatively the chemical composition and stoichiometry in the oxide-nitride stacked films. The effect of annealing temperature on the chemical composition of ON structure has been investigated. Some species, O, N, Si were redistributed in this structure during the thermal oxidation of SiNx. Indeed, oxygen diffused to the nitride layer into Si2O2N during dry oxidation.

  10. Obtention of uranium-molybdenum alloy ingots microstructure and phase characterization

    Energy Technology Data Exchange (ETDEWEB)

    Pedrosa, Tercio A.; Braga, Daniel M.; Paula, Joao Bosco de; Brina, Jose Giovanni M.; Ferraz, Wilmar B., E-mail: tap@cdtn.b, E-mail: bragadm@cdtn.b, E-mail: jbp@cdtn.b, E-mail: jgmb@cdtn.b, E-mail: ferrazw@cdtn.b [Centro de Desenvolvimento da Tecnologia Nuclear (CDTN/CNEN-MG), Belo Horizonte, MG (Brazil)

    2011-07-01

    The replacement of high enriched uranium (U-{sup 235} > 85 wt%) by low enriched uranium (U-{sup 235} < 20 wt%) nuclear fuels in research and test reactors is being implemented as an initiative of the Reduced Enrichment for Research and Test Reactors (RERTR) program, conceived in the USA since mid-70s, in order to avoid nuclear weapons proliferation. Such replacement implies in the use of compounds or alloys with higher uranium densities. Several uranium alloys that fill this requirement has been investigated since then. Among these alloys, U-Mo presents great application potential due to its physical properties and good behavior during irradiation, which makes it an important option as a nuclear fuel material for the Brazilian Multipurpose Reactor - RMB. The development of the plate-type nuclear fuel based on U-Mo alloys is being performed at the Nuclear Technology Development Centre (CDTN) and also at the Institute of Energetic and Nuclear Research - IPEN. U-{sup 10}Mo ingots were melted in an induction furnace with protective argon atmosphere. The microstructure of the ingots were characterized through optical and scanning electronic microscopy in the as cast and heat treated conditions. Energy Dispersive Spectrometry and X-Ray Diffraction were used as characterization techniques for elemental analysis and phases determination. It was confirmed the presence of metastable gamma-phase in the as cast condition, surrounded by hypereutectoid alpha-phase (uranium-rich phase), as well as a pearlite-like constituent, composed by alternated lamellas of U{sub 2}Mo compound and alpha-phase, in the heat treated condition. (author)

  11. Low temperature spalling of silicon: A crack propagation study

    Energy Technology Data Exchange (ETDEWEB)

    Bertoni, Mariana; Uberg Naerland, Tine; Stoddard, Nathan; Guimera Coll, Pablo

    2017-06-08

    Spalling is a promising kerfless method for cutting thin silicon wafers while doubling the yield of a silicon ingot. The main obstacle in this technology is the high total thickness variation of the spalled wafers, often as high as 100% of the wafer thickness. It has been suggested before that a strong correlation exists between low crack velocities and a smooth surface, but this correlation has never been shown during a spalling process in silicon. The reason lies in the challenge associated to measuring such velocities. In this contribution, we present a new approach to assess, in real time, the crack velocity as it propagates during a low temperature spalling process. Understanding the relationship between crack velocity and surface roughness during spalling can pave the way to attain full control on the surface quality of the spalled wafer.

  12. Surface Detail Reproduction and Effect of Disinfectant and Long-Term Storage on the Dimensional Stability of a Novel Vinyl Polyether Silicone Impression Material.

    Science.gov (United States)

    Nassar, Usama; Chow, Ava K

    2015-08-01

    This study investigated the surface detail reproduction and dimensional stability of a vinyl polyether silicone (VPES) in comparison to a vinylpolysiloxane (VPS) material as a function of prolonged storage for up to 2 weeks. Heavy-body VPES (EXA'lence(TM) Fast Set) and VPS (Imprint(TM) 3 Quick Step) were compared. Forty impression ingots of each material were made using a stainless steel die as described by ANSI/ADA specification No. 19. Twenty impressions of each material were disinfected by immersion in a 2.5% buffered glutaraldehyde solution. Surface quality was assessed and scored immediately after making the ingots. Dimensional stability measurements were made immediately and repeated on the same ingots after 7 and 14 days storage in ambient laboratory conditions. Data were analyzed using the D'Agostino and Pearson omnibus normality test followed by two-way repeated measures ANOVA with post hoc Bonferroni tests. Values of p < 0.01 were deemed to be significant. Disinfected VPES and VPS specimens had significantly reduced dimensional changes at 7 and 14 days when compared with the nondisinfected ones (p < 0.0001). The dimensional stability of both materials was within ANSI/ADA specification No. 19's acceptable limit throughout the 2-week test period, regardless of whether they were disinfected. Out of the initial 80 ingots, 8 VPES and 1 VPS ingot scored a 2 on the surface detail test, while the remaining 71 ingots scored 1. Heavy-body fast-set VPES experienced minimal contraction in vitro after prolonged storage, though surface detail scores were not as consistent as those of the VPS tested. The least contraction occurred when the material was examined immediately after ingot production. © 2014 by the American College of Prosthodontists.

  13. Singlet exciton fission in polycrystalline pentacene: from photophysics toward devices.

    Science.gov (United States)

    Wilson, Mark W B; Rao, Akshay; Ehrler, Bruno; Friend, Richard H

    2013-06-18

    Singlet exciton fission is the process in conjugated organic molecules bywhich a photogenerated singlet exciton couples to a nearby chromophore in the ground state, creating a pair of triplet excitons. Researchers first reported this phenomenon in the 1960s, an event that sparked further studies in the following decade. These investigations used fluorescence spectroscopy to establish that exciton fission occurred in single crystals of several acenes. However, research interest has been recently rekindled by the possibility that singlet fission could be used as a carrier multiplication technique to enhance the efficiency of photovoltaic cells. The most successful architecture to-date involves sensitizing a red-absorbing photoactive layer with a blue-absorbing material that undergoes fission, thereby generating additional photocurrent from higher-energy photons. The quest for improved solar cells has spurred a drive to better understand the fission process, which has received timely aid from modern techniques for time-resolved spectroscopy, quantum chemistry, and small-molecule device fabrication. However, the consensus interpretation of the initial studies using ultrafast transient absorption spectroscopy was that exciton fission was suppressed in polycrystalline thin films of pentacene, a material that would be otherwise expected to be an ideal model system, as well as a viable candidate for fission-sensitized photovoltaic devices. In this Account, we review the results of our recent transient absorption and device-based studies of polycrystalline pentacene. We address the controversy surrounding the assignment of spectroscopic features in transient absorption data, and illustrate how a consistent interpretation is possible. This work underpins our conclusion that singlet fission in pentacene is extraordinarily rapid (∼80 fs) and is thus the dominant decay channel for the photoexcited singlet exciton. Further, we discuss our demonstration that triplet excitons

  14. Discrete Tomography and Imaging of Polycrystalline Structures

    DEFF Research Database (Denmark)

    Alpers, Andreas

    High resolution transmission electron microscopy is commonly considered as the standard application for discrete tomography. While this has yet to be technically realized, new applications with a similar flavor have emerged in materials science. In our group at Ris� DTU (Denmark's National...... Laboratory for Sustainable Energy), for instance, we study polycrystalline materials via synchrotron X-ray diffraction. Several reconstruction problems arise, most of them exhibit inherently discrete aspects. In this talk I want to give a concise mathematical introduction to some of these reconstruction...... problems. Special focus is on their relationship to classical discrete tomography. Several open mathematical questions will be mentioned along the way....

  15. Numerical simulation of large deformation polycrystalline plasticity

    International Nuclear Information System (INIS)

    Inal, K.; Neale, K.W.; Wu, P.D.; MacEwen, S.R.

    2000-01-01

    A finite element model based on crystal plasticity has been developed to simulate the stress-strain response of sheet metal specimens in uniaxial tension. Each material point in the sheet is considered to be a polycrystalline aggregate of FCC grains. The Taylor theory of crystal plasticity is assumed. The numerical analysis incorporates parallel computing features enabling simulations of realistic models with large number of grains. Simulations have been carried out for the AA3004-H19 aluminium alloy and the results are compared with experimental data. (author)

  16. Creep cavitation effects in polycrystalline alumina

    International Nuclear Information System (INIS)

    Porter, J.R.; Blumenthal, W.; Evans, A.G.

    1981-01-01

    Fine grained polycrystalline alumina has been deformed in creep at high temperatures, to examine the evolution of cavities at grain boundaries. Cavities with equilibrium and crack-like morphologies have been observed, distributed nonuniformly throughout the material. The role of these cavities during creep has been described. A transition from equilibrium to crack-like morphology has been observed and correlated with a model based on the influence of the surface to boundary diffusivity ratio and the local tensile stress. The contribution of cavitation to the creep rate and total creep strain has been analyzed and excluded as the principal cause of the observed non-linear creep rate

  17. Anomalous Hall effect in polycrystalline Ni films

    KAUST Repository

    Guo, Zaibing

    2012-02-01

    We systematically studied the anomalous Hall effect in a series of polycrystalline Ni films with thickness ranging from 4 to 200 nm. It is found that both the longitudinal and anomalous Hall resistivity increased greatly as film thickness decreased. This enhancement should be related to the surface scattering. In the ultrathin films (46 nm thick), weak localization corrections to anomalous Hall conductivity were studied. The granular model, taking into account the dominated intergranular tunneling, has been employed to explain this phenomenon, which can explain the weak dependence of anomalous Hall resistivity on longitudinal resistivity as well. © 2011 Elsevier Ltd. All rights reserved.

  18. Silicon detectors

    International Nuclear Information System (INIS)

    Klanner, R.

    1984-08-01

    The status and recent progress of silicon detectors for high energy physics is reviewed. Emphasis is put on detectors with high spatial resolution and the use of silicon detectors in calorimeters. (orig.)

  19. Environmentally benign silicon solar cell manufacturing

    Energy Technology Data Exchange (ETDEWEB)

    Tsuo, Y.S. [National Renewable Energy Lab., Golden, CO (United States); Gee, J.M. [Sandia National Labs., Albuquerque, NM (United States); Menna, P. [National Agency for New Technologies Energy and Environment, Portici (Italy); Strebkov, D.S.; Pinov, A.; Zadde, V. [Intersolarcenter, Moscow (Russian Federation)

    1998-09-01

    The manufacturing of silicon devices--from polysilicon production, crystal growth, ingot slicing, wafer cleaning, device processing, to encapsulation--requires many steps that are energy intensive and use large amounts of water and toxic chemicals. In the past two years, the silicon integrated-circuit (IC) industry has initiated several programs to promote environmentally benign manufacturing, i.e., manufacturing practices that recover, recycle, and reuse materials resources with a minimal consumption of energy. Crystalline-silicon solar photovoltaic (PV) modules, which accounted for 87% of the worldwide module shipments in 1997, are large-area devices with many manufacturing steps similar to those used in the IC industry. Obviously, there are significant opportunities for the PV industry to implement more environmentally benign manufacturing approaches. Such approaches often have the potential for significant cost reduction by reducing energy use and/or the purchase volume of new chemicals and by cutting the amount of used chemicals that must be discarded. This paper will review recent accomplishments of the IC industry initiatives and discuss new processes for environmentally benign silicon solar-cell manufacturing.

  20. Design and burn-up analyses of new type holder for silicon neutron transmutation doping.

    Science.gov (United States)

    Komeda, Masao; Arai, Masaji; Tamai, Kazuo; Kawasaki, Kozo

    2016-07-01

    We have developed a new silicon irradiation holder with a neutron filter to increase the irradiation efficiency. The neutron filter is made of an alloy of aluminum and B4C particles. We fabricated a new holder based on the results of design analyses. This filter has limited use in applications requiring prolonged use due to a decrease in the amount of (10)B in B4C particles. We investigated the influence of (10)B reduction on doping distribution in a silicon ingot by using the Monte Carlo Code MVP. Copyright © 2016 Elsevier Ltd. All rights reserved.

  1. Effects of silicon cross section and neutron spectrum on the radial uniformity in neutron transmutation doping.

    Science.gov (United States)

    Kim, Haksung; Ho Pyeon, Cheol; Lim, Jae-Yong; Misawa, Tsuyoshi

    2012-01-01

    The effects of silicon cross section and neutron spectrum on the radial uniformity of a Si-ingot are examined experimentally with various neutron spectrum conditions. For the cross section effect, the numerical results using silicon single crystal cross section reveal good agreements with experiments within relative difference of 6%, whereas the discrepancy is approximately 20% in free-gas cross section. For the neutron spectrum effect, the radial uniformity in hard neutron spectrum is found to be more flattening than that in soft spectrum. Copyright © 2011 Elsevier Ltd. All rights reserved.

  2. Material Properties of Laser-Welded Thin Silicon Foils

    Directory of Open Access Journals (Sweden)

    M. T. Hessmann

    2013-01-01

    Full Text Available An extended monocrystalline silicon base foil offers a great opportunity to combine low-cost production with high efficiency silicon solar cells on a large scale. By overcoming the area restriction of ingot-based monocrystalline silicon wafer production, costs could be decreased to thin film solar cell range. The extended monocrystalline silicon base foil consists of several individual thin silicon wafers which are welded together. A comparison of three different approaches to weld 50 μm thin silicon foils is investigated here: (1 laser spot welding with low constant feed speed, (2 laser line welding, and (3 keyhole welding. Cross-sections are prepared and analyzed by electron backscatter diffraction (EBSD to reveal changes in the crystal structure at the welding side after laser irradiation. The treatment leads to the appearance of new grains and boundaries. The induced internal stress, using the three different laser welding processes, was investigated by micro-Raman analysis. We conclude that the keyhole welding process is the most favorable to produce thin silicon foils.

  3. Formation and growth of crystal defects in directionally solidified multicrystalline silicon for solar cells

    Energy Technology Data Exchange (ETDEWEB)

    Ryningen, Birgit

    2008-07-01

    Included in this thesis are five publications and one report. The common theme is characterisation of directionally solidified multicrystalline silicon for solar cells. Material characterisation of solar cell silicon is naturally closely linked to both the casting process and to the solar cell processing: Many of the material properties are determined by the casting process, and the solar cell processing will to some extend determine which properties will influence the solar cell performance. Solar grade silicon (SoG-Si) made by metallurgical refining route and supplied by Elkem Solar was directionally solidified and subsequently characterised, and a simple solar cell process was applied. Except from some metallic co-precipitates in the top of the ingot, no abnormalities were found, and it is suggested that within the limits of the tests performed in this thesis, the casting and the solar cell processing, rather than the assumed higher impurity content, was the limiting factor. It is suggested in this thesis that the main quality problem in multicrystalline silicon wafers is the existence of dislocation clusters covering large wafer areas. The clusters will reduce the effect of gettering and even if gettering could be performed successfully, the clusters will still reduce the minority carrier mobility and hence the solar cell performance. It has further been pointed out that ingots solidified under seemingly equal conditions might have a pronounced difference in minority carrier lifetime. Ingots with low minority carrier lifetime have high dislocation densities. The ingots with the substantially higher lifetime seem all to be dominated by twins. It is also found a link between a higher undercooling and the ingots dominated by twins. It is suggested that the two types of ingots are subject to different nucleation and crystal growth mechanisms: For the ingots dominated by dislocations, which are over represented, the crystal growth is randomly nucleated at the

  4. Giant 1/f noise in two-dimensional polycrystalline media

    International Nuclear Information System (INIS)

    Snarskii, A.; Bezsudnov, I.

    2008-01-01

    The behaviour of excess (1/f noise) in two-dimensional polycrystalline media is investigated. On the base of current trap model, it is shown that there exists a certain anisotropy value of conductivity tensor for polycrystalline media when the amplitude of 1/f noise becomes giant

  5. Ingot formation using uranium dendrites recovered by electrolysis in LiCl-KCl-PuCl{sub 3}-UCl{sub 3} melt

    Energy Technology Data Exchange (ETDEWEB)

    Mineo Fukushima; Akira Nakayoshi; Shinichi Kitawaki [Japan Atomic Energy Agency (JAEA), 4-33 Muramatsu Tokai-mura Naka-gun, Ibaraki, 319-1194 (Japan); Masaki Kurata; Noboru Yahagi [Central Research Institute of Electric Power Industry (CRIEPI), 2-11-1 Iwadokita Komae-shi, Tokyo, 201-8511 (Japan)

    2008-07-01

    Products on solid cathodes recovered by the metal pyrochemical processing were processed to obtain uranium ingot. Studies on process conditions of uranium formation, assay recovered uranium products and by-products and evaluation of mass balance were carried out. In these tests, it is confirmed that uranium ingots can be obtained with heating the products more than melting temperature of metal uranium under atmospheric pressure because adhered salt cover the uranium not to oxidize it during uranium cohering. Covered salt can be removed after ingot formation. Inside the ingot, there were a lump of uranium and dark brown colored dross was observed. Material balance of uranium is 77 {approx} 96%, that of plutonium is 71 {approx} 109%, and that of americium that is a volatile substance more than uranium and plutonium become 79 {approx} 119%. Volatilization of americium is very small under the condition of high temperature. (authors)

  6. Sequential separation of transuranic elements and fission products from uranium metal ingots in electrolytic reduction process of spent PWR fuels

    International Nuclear Information System (INIS)

    Chang Heon Lee; Kih Soo Joe; Won Ho Kim; Euo Chang Jung; Kwang Yong Jee

    2009-01-01

    A sequential separation procedure has been developed for the determination of transuranic elements and fission products in uranium metal ingot samples from an electrolytic reduction process for a metallization of uranium dioxide to uranium metal in a medium of LiCl-Li 2 O molten salt at 650 deg C. Pu, Np and U were separated using anion-exchange and tri-n-butylphosphate (TBP) extraction chromatography. Cs, Sr, Ba, Ce, Pr, Nd, Sm, Eu, Gd, Zr and Mo were separated in several groups from Am and Cm using TBP and di(2-ethylhexyl)phosphoric acid (HDEHP) extraction chromatography. Effect of Fe, Ni, Cr and Mg, which were corrosion products formed through the process, on the separation of the analytes was investigated in detail. The validity of the separation procedure was evaluated by measuring the recovery of the stable metals and 239 Pu, 237 Np, 241 Am and 244 Cm added to a synthetic uranium metal ingot dissolved solution. (author)

  7. CVD polycrystalline diamond. A novel neutron detector and applications

    International Nuclear Information System (INIS)

    Mongkolnavin, R.

    1998-01-01

    Chemical Vapour Deposition (CVD) Polycrystalline Diamond film has been investigated as a low noise sensor for beta particles, gammas and neutrons using High Energy Physics technologies. Its advantages and disadvantages have been explored in comparison with other particle detectors such as silicon detector and other plastic scintillators. The performance and characteristic of the diamond detector have been fully studied and discussed. These studies will lead to a better understanding of how CVD diamonds perform as a detector and how to improve their performance under various conditions. A CVD diamond detector model has been proposed which is an attempt to explain the behaviour of such an extreme detector material. A novel neutron detector is introduced as a result of these studies. A good thermal and fast neutron detector can be fabricated with CVD diamond with new topologies. This detector will perform well without degradation in a high neutron radiation environment, as diamond is known to be radiation hard. It also offers better neutrons and gammas discrimination for high gamma background applications compared to other semiconductor detectors. A full simulation of the detector has also been done using GEANT, a Monte-Carlo simulation program for particle detectors. Simulation results show that CVD diamond detectors with this novel topology can detect neutrons with great directionality. Experimental work has been done on this detector in a nuclear reactor environment and accelerator source. A novel neutron source which offers a fast pulse high-energy neutrons has also been studied. With this detector, applications in neutron spectrometer for low-Z material have been pursued with various neutron detection techniques. One of these is a low-Z material identification system. The system has been designed and simulated for contraband luggage interrogation using the detector and the novel neutron source. Also other neutron related applications have been suggested. (author)

  8. CVD polycrystalline diamond. A novel neutron detector and applications

    International Nuclear Information System (INIS)

    Mongkolnavin, R.

    1998-07-01

    Chemical Vapour Deposition (CVD) Polycrystalline Diamond film has been investigated as a low noise sensor for beta particles, gammas and neutrons using High Energy Physics technologies. Its advantages and disadvantages have been explored in comparison with other particle detectors such as silicon detector and other plastic scintillators. The performance and characteristic of the diamond detector have been fully studied and discussed. These studies will lead to a better understanding of how CVD diamonds perform as a detector and how to improve their performance under various conditions. A CVD diamond detector model has been proposed which is an attempt to explain the behaviour of such an extreme detector material. A novel neutron detector is introduced as a result of these studies. A good thermal and fast neutron detector can be fabricated with CVD diamond with new topologies. This detector will perform well without degradation in a high neutron radiation environment, as diamond is known to be radiation-hard. It also offers better neutrons and gammas discrimination for high gamma background applications compared to other semiconductor detectors. A full simulation of the detector has also been done using GEANT, a Monte Carlo simulation program for particle detectors. Simulation results show that CVD diamond detectors with this novel topology can detect neutrons with great directionality. Experimental work has been done on this detector in a nuclear reactor environment and accelerator source. A novel neutron source which offers a fast pulse high-energy neutrons has also been studied. With this detector, applications in neutron spectrometry for low-Z material have been pursued with various neutron detection techniques. One of these is a low-Z material identification system. The system has been designed and simulated for contraband luggage interrogation using the detector and the novel neutron source. (author)

  9. Research on fabrication technology for thin film solar cells for practical use. Technological development for qualitative improvement (development of fabrication technology of thin film polycrystalline Si solar cell); Usumaku taiyo denchi seizo gijutsu no jitsuyoka kenkyu. Kohinshitsuka gijutsu (usumaku takessho silicon kei taiyo denchi seizo no gijutsu kaihatsu)

    Energy Technology Data Exchange (ETDEWEB)

    Tatsuta, M [New Energy and Industrial Technology Development Organization, Tokyo (Japan)

    1994-12-01

    This paper reports the study results on the fabrication technology of thin film polycrystalline Si solar cells in fiscal 1994. (1) On the fabrication technology of high-quality Si thin films, the new equipment was studied which allows uniform stable melting recrystallization over a large area. The new equipment adopted a heating method based on RTP system, and is now under adjustment. (2) On the fabrication technology of light/carrier confinement structure, degradation of hydrogen-treated thin film Si solar cells by light irradiation was examined. As a result, since any characteristic degradation was not found even by long time light irradiation, the high quality of the cells was confirmed regardless of hydrogen-treatment. Fabrication of stable reproducible fine texture structure became possible by using fabrication technology of light confinement structure by texture treatment of cell surfaces. (3) On low-cost process technology, design by VEST process, estimation of cell characteristics by simulation, and characteristics of prototype cells were reported. 33 figs., 1 tab.

  10. Silicon nanocrystal films for electronic applications

    Energy Technology Data Exchange (ETDEWEB)

    Lechner, Robert W.

    2009-02-06

    Whether nanoparticles of silicon are really suited for such applications, whether layers fabricated from this exhibit semiconducting properties, whether they can be doped, and whether for instance via the doping the conductivity can be tuned, was studied in the present thesis. Starting material for this were on the one hand spherical silicon nanocrystals with a sharp size distribution and mean diameters in the range from 4-50 nm. Furthermore silicon particle were available, which are with 50-500 nm distinctly larger and exhibit a broad distribution of the mean size and a polycrystalline fine structure with strongly bifurcated external morphology. The small conductivities and tje low mobility values of the charge carriers in the layers of silicon nanocrystals suggest to apply suited thermal after-treatment procedures. So was found that the aluminium-induced layer exchange (ALILE) also can be transferred to the porous layers of nanocrystals. With the deuteron passivation a method was available to change the charge-carrier concentration in the polycrystalline layers. Additionally to ALILE laser crystallization as alternative after-treatment procedure of the nanocrystal layers was studied.

  11. Evolution of A-Type Macrosegregation in Large Size Steel Ingot After Multistep Forging and Heat Treatment

    Science.gov (United States)

    Loucif, Abdelhalim; Ben Fredj, Emna; Harris, Nathan; Shahriari, Davood; Jahazi, Mohammad; Lapierre-Boire, Louis-Philippe

    2018-06-01

    A-type macrosegregation refers to the channel chemical heterogeneities that can be formed during solidification in large size steel ingots. In this research, a combination of experiment and simulation was used to study the influence of open die forging parameters on the evolution of A-type macrosegregation patterns during a multistep forging of a 40 metric ton (MT) cast, high-strength steel ingot. Macrosegregation patterns were determined experimentally by macroetch along the longitudinal axis of the forged and heat-treated ingot. Mass spectroscopy, on more than 900 samples, was used to determine the chemical composition map of the entire longitudinal sectioned surface. FORGE NxT 1.1 finite element modeling code was used to predict the effect of forging sequences on the morphology evolution of A-type macrosegregation patterns. For this purpose, grain flow variables were defined and implemented in a large scale finite element modeling code to describe oriented grains and A-type segregation patterns. Examination of the A-type macrosegregation showed four to five parallel continuous channels located nearly symmetrical to the axis of the forged ingot. In some regions, the A-type patterns became curved or obtained a wavy form in contrast to their straight shape in the as-cast state. Mass spectrometry analysis of the main alloying elements (C, Mn, Ni, Cr, Mo, Cu, P, and S) revealed that carbon, manganese, and chromium were the most segregated alloying elements in A-type macrosegregation patterns. The observed differences were analyzed using thermodynamic calculations, which indicated that changes in the chemical composition of the liquid metal can affect the primary solidification mode and the segregation intensity of the alloying elements. Finite element modeling simulation results showed very good agreement with the experimental observations, thereby allowing for the quantification of the influence of temperature and deformation on the evolution of the shape of the

  12. Procedure for the qualification of a manufacturer of ingot iron pieces for application in nuclear power plant components

    International Nuclear Information System (INIS)

    Rahn, K.M.M.; Jusevicius, E.; Michael, H.

    1981-01-01

    The process for the qualification of 'Sao Caetano do Sul (Acos Villares S/A)' Plant as manufacturers of ingot iron pieces for application in components of Angra 2 and Angra 3 Nuclear Power Plants, is presented. The qualification was executed by IBQN - Instituto Brasileiro de Qualidade Nuclear - the organ officially in charge of the execution of qualification of suppliers of materials for the nuclear industry. (E.G.) [pt

  13. Four-Phase Dendritic Model for the Prediction of Macrosegregation, Shrinkage Cavity, and Porosity in a 55-Ton Ingot

    Science.gov (United States)

    Ge, Honghao; Ren, Fengli; Li, Jun; Han, Xiujun; Xia, Mingxu; Li, Jianguo

    2017-03-01

    A four-phase dendritic model was developed to predict the macrosegregation, shrinkage cavity, and porosity during solidification. In this four-phase dendritic model, some important factors, including dendritic structure for equiaxed crystals, melt convection, crystals sedimentation, nucleation, growth, and shrinkage of solidified phases, were taken into consideration. Furthermore, in this four-phase dendritic model, a modified shrinkage criterion was established to predict shrinkage porosity (microporosity) of a 55-ton industrial Fe-3.3 wt pct C ingot. The predicted macrosegregation pattern and shrinkage cavity shape are in a good agreement with experimental results. The shrinkage cavity has a significant effect on the formation of positive segregation in hot top region, which generally forms during the last stage of ingot casting. The dendritic equiaxed grains also play an important role on the formation of A-segregation. A three-dimensional laminar structure of A-segregation in industrial ingot was, for the first time, predicted by using a 3D case simulation.

  14. On numerical modeling of low-head direct chill ingot caster for magnesium alloy AZ31

    Directory of Open Access Journals (Sweden)

    Mainul Hasan

    2014-12-01

    Full Text Available A comprehensive 3D turbulent CFD study has been carried out to simulate a Low-Head (LH vertical Direct Chill (DC rolling ingot caster for the common magnesium alloy AZ31. The model used in this study takes into account the coupled laminar/turbulent melt flow and solidification aspects of the process and is based on the control-volume finite-difference approach. Following the aluminum/magnesium DC casting industrial practices, the LH mold is taken as 30 mm with a hot top of 60 mm. The previously verified in-house code has been modified to model the present casting process. Important quantitative results are obtained for four casting speeds, for three inlet melt pouring temperatures (superheats and for three metal-mold contact heat transfer coefficients for the steady state operational phase of the caster. The variable cooling water temperatures reported by the industry are considered for the primary and secondary cooling zones during the simulations. Specifically, the temperature and velocity fields, sump depth and sump profiles, mushy region thickness, solid shell thickness at the exit of the mold and axial temperature profiles at the center and at three strategic locations at the surface of the slab are presented and discussed.

  15. Obtention of uranium-molybdenum alloy ingots technique to avoid carbon contamination

    Energy Technology Data Exchange (ETDEWEB)

    Pedrosa, Tercio A.; Paula, Joao Bosco de; Reis, Sergio C.; Brina, Jose Giovanni M.; Faeda, Kelly Cristina M.; Ferraz, Wilmar B., E-mail: tap@cdtn.b, E-mail: jbp@cdtn.b, E-mail: jgmb@cdtn.b, E-mail: ferrazw@cdtn.b [Centro de Desenvolvimento da Tecnologia Nuclear (CDTN/CNEN-MG), Belo Horizonte, MG (Brazil)

    2011-07-01

    The replacement of high enriched uranium (U{sup 235} > 85 wt%) by low enriched uranium (U{sup 235} < 20wt%) nuclear fuels in research and test reactors is being implemented as an initiative of the Reduced Enrichment for Research and Test Reactors (RERTR) program, conceived in the USA since mid-70s, in order to avoid nuclear weapons proliferation. Such replacement implies in the use of compounds or alloys with higher uranium densities. Among the several uranium alloys investigated since then, U-Mo presents great application potential due to its physical properties and good behavior during irradiation, which makes it an important option as a nuclear fuel material for the Brazilian Multipurpose Reactor - RMB. The development of the plate-type nuclear fuel based on U-Mo alloy is being performed at the Nuclear Technology Development Centre (CDTN) and also at IPEN. The carbon contamination of the alloy is one of the great concerns during the melting process. It was observed that U-Mo alloy is more critical considering carbon contamination when using graphite crucibles. Alternative melting technique was implemented at CDTN in order to avoid carbon contamination from graphite crucible using Yttria stabilized ZrO{sub 2} crucibles. Ingots with low carbon content and good internal quality were obtained. (author)

  16. Measurement of the ratio of liquid to solid phases in a continuous ingot

    International Nuclear Information System (INIS)

    Deryabina, G.N.; Ripp, A.G.

    1980-01-01

    A radiometric method of measuring the ratio of liquid and solid phases (crust thickness) in a continuous ingot for automation of the continuous steel casting process, has been proposed. The essence of the method is, that radiation flux, bearing information on the object tested, is transformed in a succession of electric pulses, which is processed afterwords for obtaining necessary information. In this case either the flux of non-scattered radiation, passed through the object, or the flux of single-scattered radiation reflected from the object is registered. Block-diagram and specifications of a radiometric device with the Co source of 50 gxequiv. Ra activity developed for this purpose are presented. The technique for calibration ob the device and the results of its tests, are described. It is shown, that introduction of such devices for the control crust thickness at the installations of continuous steel casting of metallurgical works would permit to exercise casting in the optimum regime, to exclude metal leakage, to increase its quality and yield of the useful metal

  17. Copper alloys with improved properties: standard ingot metallurgy vs. powder metallurgy

    Directory of Open Access Journals (Sweden)

    Milan T. Jovanović

    2014-09-01

    Full Text Available Three copper-based alloys: two composites reinforced with Al2O3 particles and processed through powder metallurgy (P/M route, i.e. by internal oxidation (Cu-2.5Al composite and by mechanical alloying (Cu-4.7Al2O3 and Cu-0.4Cr-0.08Zr alloy produced by ingot metallurgy (vacuum melting and casting were the object of this investigation. Light microscope and scanning electron microscope (SEM equipped with electron X-ray spectrometer (EDS were used for microstructural characterization. Microhardness and electrical conductivity were also measured. Compared to composite materials, Cu-0.4Cr-0.08Zr alloy possesses highest electrical conductivity in the range from 20 to 800 ℃, whereas the lowest conductivity shows composite Cu-2.5Al processed by internal oxidation. In spite to somewhat lower electrical conductivity (probably due to inadequate density, Cu-2.5Al composite exhibits thermal stability enabling its application at much higher temperatures than materials processed by mechanical alloying or by vacuum melting and casting.

  18. Influence of transport mechanisms on nucleation and grain structure formation in DC cast aluminium alloy ingots

    Science.gov (United States)

    Bedel, M.; Založnik, M.; Kumar, A.; Combeau, H.; Jarry, P.; Waz, E.

    2012-01-01

    The grain structure formation in direct chill (DC) casting is directly linked to nucleation, which is generally promoted by inoculation. Inoculation prevents defects, but also modifies the physical properties by changing the microstructure. We studied the coupling of the nucleation on inoculant particles and the grain growth in the presence of melt flow induced by thermosolutal convection and of the transport of free-floating equiaxed grains. We used a volume-averaged two-phase multiscale model with a fully coupled description of phenomena on the grain scale (nucleation on grain refiner particles and grain growth) and on the product scale (macroscopic transport). The transport of inoculant particles is also modeled, which accounts for the inhomogeneous distribution of inoculant particles in the melt. The model was applied to an industrial sized (350mm thick) DC cast aluminium alloy ingot. A discretised nuclei size distribution was defined and the impact of different macroscopic phenomena on the grain structure formation was studied: the zone and intensity of nucleation and the resulting grain size distribution. It is shown that nucleation in the presence of macroscopic transport cannot be explained only in terms of cooling rate, but variations of composition, nuclei density and grain density, all affected by transport, must be accounted for.

  19. Considerations for improved polycrystalline cuprate superconductors

    International Nuclear Information System (INIS)

    Shinde, S.L.; Shaw, T.M.

    1990-01-01

    Polycrystalline cuprate superconductors exhibit two-stage superconducting transitions, that are characteristic of granular systems. This behaviour suggests approaches involving improvements in intra and inter-grain properties in order to improve the technologically important superconducting properties such as the magnetic remanent moment and transport critical current density. This paper reports results of our studies on oxygenation, twin density control through grain size and changes in flux pinning within the YBa 2 Cu 3 O 7-δ matrix with Ag substitution under the heading of intra-grain properties and the detrimental effect of grain boundary phases and the effect of Ag substitution on grain boundary pinning under the heading of inter-grain properties

  20. Mechanical properties of porous PNZT polycrystalline ceramics

    International Nuclear Information System (INIS)

    Biswas, D.R.; Fulrath, R.M.

    1977-08-01

    Niobium-doped lead zirconate-titanate (PNZT) was used to investigate the effect of porosity on the mechanical properties of a polycrystalline ceramic. Spherical pores (110 to 150 μm diameter) were introduced by using organic materials in the initial specimen fabrication. The matrix grain size (2 to 5 μm) was kept constant. Small pores (2 to 3 μm diameter) of the order of the grain size were formed by varying the sintering conditions. The effect of porosity on strength was predicted quite well by Weibull's probabilistic approach. The Young's modulus showed a linear relationship with increase in porosity. A decrease in fracture toughness with increase in porosity was also observed. It was found that at equivalent porosities, small pore specimens gave higher strength, Young's modulus and fracture toughness compared to specimens containing large pores. Fracture surface analysis, by scanning electron microscopy, showed fracture originated either at the tensile surface or at the edge of the specimen

  1. 3D study in modelling in static regime of a bi facial polycrystalline solar cell under intense light and under a constant magnetic field

    International Nuclear Information System (INIS)

    ZOUNGRANA Martial

    2010-01-01

    In this work we propose a three-dimensional (3D) study of magnetic field, light concentration and electron gradient concentration electric field respective influences on bi facial polycrystalline silicon solar cell behaviour. The hold account of these parameters in our study leads to the new expressions of continuity equations, electric and electronic parameters. On the basis of these equations, grain size, grain boundary recombination velocity, magnetic field and light intensity effects on carriers density, photocurrent, photovoltage, electric and electronic parameters are analysed. We finally propose an equivalent electric model of bi facial polycrystalline silicon solar cell under magnetic field. According to this model, electric parameters expressions was established (shunt and series resistances, space charge zone capacity ) and we study magnetic field, grain size, grain boundary recombination velocity and light concentration influences on these parameters.(Author) [fr

  2. Magnetostrictive properties of polycrystalline iron cobalt films

    International Nuclear Information System (INIS)

    Cooke, M.D.

    2000-10-01

    This thesis is concerned with the magnetic properties of magnetostrictive FeCo polycrystalline alloy films produced by RF magnetron sputter deposition. The bulk material is known to have highly magnetostrictive properties, coupled with the possibility of a low anisotropy with the correct thermal treatment to allow ordering. Significant reduction in the anisotropy was found by using post depostional thermal treatment in Ar/H. It has been demonstrated that it is possible to produce FeCo films with magnetostrictive properties similar to those found in the bulk. Detailed examination showed an increased peak in the magnetostriction with composition which had not been previously viewed in the bulk materials. Initial development was also made of a novel co-depositional technique to allow magnetostrictive determination as a function of composition in a single deposition. Development was made of a technique using the Daresbury Synchrotron research facility and the XRD equipment to allow determination of the magnetostriction coefficients of polycrystalline films. This is the first time this has been achieved for thin film materials and provides exciting new possibilities for the future. A critique was made of the optical cantilever technique for determining magnetostriction. Clear consideration has to be made of rotational and frequency effects. A new analytical theory was devised which allowing determination of the cantilever deflection for similar substrate and film thickness. This is essential for development of current trends in nanotechnology. The results were then optimised for use in sensor and actuator devices providing novel results. Finally investigation was made of the possible effects of surfaces on the magnetic properties. The magnetostriction of FeCo/Ag multilayers and Ag embedded in an FeCo matrix are compared. These clearly show the influence of surface and illustrate the importance of considering the technique used to determine the magnetostriction. (author)

  3. IMPEDANCE SPECTROSCOPY OF POLYCRYSTALLINE TIN DIOXIDE FILMS

    Directory of Open Access Journals (Sweden)

    D. V. Adamchuck

    2016-01-01

    Full Text Available The aim of this work is the analysis of the influence of annealing in an inert atmosphere on the electrical properties and structure of non-stoichiometric tin dioxide films by means of impedance spectroscopy method. Non-stoichiometric tin dioxide films were fabricated by two-step oxidation of metallic tin deposited on the polycrystalline Al2O3 substrates by DC magnetron sputtering. In order to modify the structure and stoichiometric composition, the films were subjected to the high temperature annealing in argon atmosphere in temperature range 300–800 °С. AC-conductivity measurements of the films in the frequency range 20 Hz – 2 MHz were carried out. Variation in the frequency dependencies of the real and imaginary parts of the impedance of tin dioxide films was found to occur as a result of high-temperature annealing. Equivalent circuits for describing the properties of films with various structure and stoichiometric composition were proposed. Possibility of conductivity variation of the polycrystalline tin dioxide films as a result of аnnealing in an inert atmosphere was demonstrated by utilizing impedance spectroscopy. Annealing induces the recrystallization of the films, changing in their stoichiometry as well as increase of the sizes of SnO2 crystallites. Variation of electrical conductivity and structure of tin dioxide films as a result of annealing in inert atmosphere was confirmed by X-ray diffraction analysis. Analysis of the impedance diagrams of tin dioxide films was found to be a powerful tool to study their electrical properties. 

  4. Synthesis of silane and silicon in a non-equilibrium plasma jet

    Science.gov (United States)

    Calcote, H. F.; Felder, W.

    1977-01-01

    The feasibility of using a non-equilibrium hydrogen plasma jet as a chemical synthesis tool was investigated. Four possible processes were identified for further study: (1) production of polycrystalline silicon photovoltaic surfaces, (2) production of SiHCl3 from SiCl4, (3) production of SiH4 from SiHCl3, and (4) purification of SiCl4 by metal impurity nucleation. The most striking result was the recognition that the strongly adhering silicon films, amorphous or polycrystalline, produced in our studies could be the basis for preparing a photovoltaic surface directly; this process has potential advantages over other vapor deposition processes.

  5. Analysis of twelve-month degradation in three polycrystalline photovoltaic modules

    Science.gov (United States)

    Lai, T.; Potter, B. G.; Simmons-Potter, K.

    2016-09-01

    Polycrystalline silicon photovoltaic (PV) modules have the advantage of lower manufacturing cost as compared to their monocrystalline counterparts, but generally exhibit both lower initial module efficiencies and more significant early-stage efficiency degradation than do similar monocrystalline PV modules. For both technologies, noticeable deterioration in power conversion efficiency typically occurs over the first two years of usage. Estimating PV lifetime by examining the performance degradation behavior under given environmental conditions is, therefore, one of continual goals for experimental research and economic analysis. In the present work, accelerated lifecycle testing (ALT) on three polycrystalline PV technologies was performed in a full-scale, industrial-standard environmental chamber equipped with single-sun irradiance capability, providing an illumination uniformity of 98% over a 2 x 1.6m area. In order to investigate environmental aging effects, timedependent PV performance (I-V characteristic) was evaluated over a recurring, compressed day-night cycle, which simulated local daily solar insolation for the southwestern United States, followed by dark (night) periods. During a total test time of just under 4 months that corresponded to a year equivalent exposure on a fielded module, the temperature and humidity varied in ranges from 3°C to 40°C and 5% to 85% based on annual weather profiles for Tucson, AZ. Removing the temperature de-rating effect that was clearly seen in the data enabled the computation of normalized efficiency degradation with time and environmental exposure. Results confirm the impact of environmental conditions on the module long-term performance. Overall, more than 2% efficiency degradation in the first year of usage was observed for all thee polycrystalline Si solar modules. The average 5-year degradation of each PV technology was estimated based on their determined degradation rates.

  6. Polycrystalline semiconductor probes for monitoring the density distribution of an intense thermal neutron flux in nuclear reactors

    International Nuclear Information System (INIS)

    Graul, J.; Mueller, R.G.; Wagner, E.

    1975-05-01

    The applicability of semiconductor detectors for high thermal neutron flux densities is theoretically estimated and experimentally examined. For good thermal stability and low radiation capture rate silicon carbide is used as semiconductor material, produced in polycristalline layers to achieve high radiation resistance. The relations between crystallinity, photoelectric sensitivity and radiation resistance are shown. The radiation resistance of polycrystalline SiC-probes is approximately 100 times greater than that of conventional single crystal radiation detectors. For thermal neutron measurement they can be used in the flux range of approx. 10 10 13 (cm -2 sec -1 ) with operation times of 1.6 a >= tsub(b,max) >= 30 d, resp. (orig.) [de

  7. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading

    Energy Technology Data Exchange (ETDEWEB)

    Lambert, P. K.; Hustedt, C. J.; Zhao, M.; Ananiadis, A. G.; Hufnagel, T. C. [Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Vecchio, K. S. [Department of NanoEngineering, University of California San Diego, La Jolla, California 92093 (United States); Huskins, E. L. [Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830 (United States); US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Casem, D. T. [US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States); Gruner, S. M. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, New York 14853 (United States); Tate, M. W.; Philipp, H. T.; Purohit, P.; Weiss, J. T. [Department of Physics, Cornell University, Ithaca, New York 14853 (United States); Woll, A. R. [Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States); Kannan, V.; Ramesh, K. T. [Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States); Kenesei, P.; Okasinski, J. S.; Almer, J. [X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

    2014-09-15

    We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.

  8. Report on achievements in fiscal 1999. Development of energy usage rationalizing silicon manufacturing process (Development of manufacturing technology for mass production of silicon for solar cells); 1999 nendo energy shiyo gorika silicon seizo process kaihatsu seika hokokusho. Taiyo denchiyo silicon ryosanka seizo gijutsu no kaihatsu

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2000-03-01

    Discussions were given on manufacture of raw material silicon for solar cells with regard to boron removal, solidification, finishing and refining of metallic impurities, refining of unutilized silicon scraps, and making them into wafers and solar cells after refining. This paper summarizes the achievements in fiscal 1999. With regard to purity deterioration due to contamination by boron containing silica powder generated during the boron removal in the manufacturing process, the facilities were modified resulting in the reduction thereof to 0.04 ppmw or less. Regarding the repetitive use of boron removing crucibles, the experiment identified the possibility of using them for more than three times. In trial fabrication of samples by using the solidification refining and cast integrated process, ingots of 550 mm square and about 300 mm high were obtained, which were sliced into 10-cm square materials for use as wafers. Measurement of the conversion efficiency has resulted in 13% or more which is almost equivalent in the center and edges of the ingot. It was revealed that solar cell wafers may be fabricated by using this process, which can use either the p-type low-resistance silicon scraps or the metallic silicon as the starting material. (NEDO)

  9. Neutron transmutation doping of silicon in the SAFARI-1 research reactor

    International Nuclear Information System (INIS)

    Louw, P.A.; Robertson, D.G.; Strydom, W.J.

    1994-01-01

    The SAFARI-1 research reactor has operated with an exemplary safety record since commissioning in 1965. As part of a commercialisation effort a silicon irradiation facility (SILIRAD) has been installed in the poolside region of SAFARI-1 for Neutron Transmutation Doping (NTD) of silicon. Commissioning of the facility took place in the last quarter of 1992 with a series of trial irradiations which were performed in close collaboration with Wacker Chemitronic of Germany. A methodology for the determination of irradiation times necessary to achieve the target resistivities was verified on the basis of the results from the trial irradiations. All production activities are controlled by quality assurance procedures. To date some hundred and twelve silicon ingots (103 mm diameter) have been successfully irradiated on a commercial contract basis. The observed axial and radial variations in the resistivity profile of the ingots are very small compared to the profiles associated with conventionally doped silicon and small tolerances on target resistivities are attained. In this paper an overview of the design and characterisation of SILIRAD is given and the methods applied that ensure a quality product are described. Results obtained from trial and production irradiations are presented and the envisaged future modifications to SILIRAD discussed

  10. Neutron transmutation doping of silicon in the safari-1 research reactor

    International Nuclear Information System (INIS)

    Louw, P.A.; Robertson, D.G.; Strydom, W.J.

    1994-01-01

    The SAFARI-1 research reactor has operated with an exemplary safety record since commissioning in 1965. As part of a commercialisation effort a silicon irradiation facility (SILIRAD) has been installed in the poolside region of SAFARI-1 for Neutron Transmutation Doping (NTD) of silicon. Commissioning of the facility took place in the last quarter of 1992 with a series of trial irradiations which were performed in close collaboration the Wacker Chemitronic of Germany. A methodology for the determination of irradiation times necessary to achieve the target resistivities was verified on the basis of the results from the trial irradiations. All production activities are controlled by quality assurance procedures. To date some hundred and twelve silicon ingots (103 mm diameter) have been successfully irradiated on a commercial contract basis. The observed axial and radial variations in the resistivity profile of the ingots are very small compared to the profiles associated with conventionally doped silicon and small tolerances on target resistivities are attained. In this paper an overview of the design and characterisation of SILIRAD is given and the methods applied that ensure a quality product are described. Results obtained from trial and production irradiations are presented and the envisaged future modifications to SILIRAD discussed. 10 refs., 2 tabs., 6 figs

  11. Surface damage on polycrystalline β-SiC by xenon ion irradiation at high fluence

    Science.gov (United States)

    Baillet, J.; Gavarini, S.; Millard-Pinard, N.; Garnier, V.; Peaucelle, C.; Jaurand, X.; Duranti, A.; Bernard, C.; Rapegno, R.; Cardinal, S.; Escobar Sawa, L.; De Echave, T.; Lanfant, B.; Leconte, Y.

    2018-05-01

    Polycrystalline β-silicon carbide (β-SiC) pellets were prepared by Spark Plasma Sintering (SPS). These were implanted at room temperature with 800 keV xenon at ion fluences of 5.1015 and 1.1017 cm-2. Microstructural modifications were studied by electronic microscopy (TEM and SEM) and xenon profiles were determined by Rutherford Backscattering Spectroscopy (RBS). A complete amorphization of the implanted area associated with a significant oxidation is observed for the highest fluence. Large xenon bubbles formed in the oxide phase are responsible of surface swelling. No significant gas release has been measured up to 1017 at.cm-2. A model is proposed to explain the different steps of the oxidation process and xenon bubbles formation as a function of ion fluence.

  12. On the use of silicon as thermal neutron filter

    International Nuclear Information System (INIS)

    Adib, M.; Habib, N.; Ashry, A.; Fathalla, M.

    2003-01-01

    A simple formula is given which allows to calculate the contribution of the total neutron cross-section including the Bragg scattering from different (hkl) planes to the neutron transmission through a solid crystalline silicon. The formula takes into account the silicon form of poly or mono crystals and its parameters. A computer program DSIC was developed to provide the required calculations. The calculated values of the total neutron cross-section of perfect silicon crystal at room and liquid nitrogen temperatures were compared with the experimental ones. The obtained agreement shows that the simple formula fits the experimental data with sufficient accuracy. A good agreement was also obtained between the calculated and measured values of polycrystalline silicon in the energy range from 5 eV to 500 μeV. The feasibility study on using a poly-crystalline silicon as a cold neutron filter and mono-crystalline as a thermal neutron one is given. The optimum crystal thickness, mosaic spread, temperature and cutting plane for efficiently transmitting the thermal reactor neutrons, while rejecting both fast neutrons and gamma rays accompanying the thermal ones for the mono crystalline silicon are also given

  13. On the use of silicon as thermal neutron filter

    Energy Technology Data Exchange (ETDEWEB)

    Adib, M.; Habib, N.; Ashry, A.; Fathalla, M. E-mail: mohamedfathalla@hotmail.com

    2003-12-01

    A simple formula is given which allows to calculate the contribution of the total neutron cross-section including the Bragg scattering from different (hkl) planes to the neutron transmission through a solid crystalline silicon. The formula takes into account the silicon form of poly or mono crystals and its parameters. A computer program DSIC was developed to provide the required calculations. The calculated values of the total neutron cross-section of perfect silicon crystal at room and liquid nitrogen temperatures were compared with the experimental ones. The obtained agreement shows that the simple formula fits the experimental data with sufficient accuracy. A good agreement was also obtained between the calculated and measured values of polycrystalline silicon in the energy range from 5 eV to 500 {mu}eV. The feasibility study on using a poly-crystalline silicon as a cold neutron filter and mono-crystalline as a thermal neutron one is given. The optimum crystal thickness, mosaic spread, temperature and cutting plane for efficiently transmitting the thermal reactor neutrons, while rejecting both fast neutrons and gamma rays accompanying the thermal ones for the mono crystalline silicon are also given.

  14. Loss of shear strength in polycrystalline tungsten under shock compression

    International Nuclear Information System (INIS)

    Dandekar, D.P.

    1976-01-01

    A reexamination of existing data on shock compression of polycrystalline tungsten at room temperature indicates that tungsten may be an exception to the common belief that metals do not behave like elastic-isotropic solids under shock compression

  15. Research and development of photovoltaic power system. Development of novel technologies for fabrication of high quality silicon thin films for solar cells; Taiyoko hatsuden system no kenkyu kaihatsu. Kohinshitsu silicon usumaku sakusei gijutsu

    Energy Technology Data Exchange (ETDEWEB)

    Shimizu, T [Kanazawa University, Ishikawa (Japan). Faculty of Engineering

    1994-12-01

    Described herein are the results of the FY1994 research program for development of novel technologies for fabrication of high quality thin films of silicon for solar cells. The study on the mechanisms and effects of chemical annealing reveals that the film structure greatly varies depending on substrate temperature during the hydrotreatment process, based on the tests with substrate temperature, deposition of superthin film (T1) and hydrotreatment (T2) as the variable parameters. Chemical annealing at low temperature produces a high-quality a-Si:H film of low defect content. The study on fabrication of thin polycrystalline silicon films at low temperature observes on real time the process of deposition of the thin films on polycrystalline silicon substrates, where a natural oxide film is removed beforehand from the substrate. The results indicate that a thin polycrystalline silicon film of 100% crystallinity can be formed even on a polycrystalline silicon substrate by controlling starting gas composition and substrate temperature. The layer-by-layer method is used as the means for forming the seed crystals on a glass substrate, where deposition and hydrotreatment are repeated alternately, to produce the thin crystalline silicon films of high crystallinity. 3 figs.

  16. Deuterium transport and trapping in polycrystalline tungsten

    International Nuclear Information System (INIS)

    Anderl, R.A.; Holland, D.F.; Longhurst, G.R.; Pawelko, R.J.; Trybus, C.L.; Sellers, C.H.

    1992-01-01

    This paper reports that deuterium permeation studies for polycrystalline tungsten foil have been conducted to provide data for estimating tritium transport and trapping in tungsten-clad divertors proposed for advanced fusion-reactor concepts. Based on a detailed transmission electron microscopy (TEM) microstructural characterization of the specimen material and on analyses of permeation data measured at temperatures ranging form 610 to 823 K for unannealed and annealed tungsten foil (25 μm thick), the authors note the following key results: deuterium transport in tungsten foil is dominated by extensive trapping that varies inversely with prior anneal temperatures of the foil material, the reduction in the trapped fraction correlates with a corresponding elimination of a high density of dislocations in cell-wall structures introduced during the foil fabrication process, trapping behavior in these foils can be modelled using trap energies between 1.3 eV and 1.5 eV and trap densities ranging from 1 x 10 -5 atom fraction

  17. Thermomechanical characterization of pure polycrystalline tantalum

    International Nuclear Information System (INIS)

    Rittel, D.; Bhattacharyya, A.; Poon, B.; Zhao, J.; Ravichandran, G.

    2007-01-01

    The thermomechanical behavior of pure polycrystalline tantalum has been characterized over a wide range of strain rates, using the recently developed shear compression specimen [D. Rittel, S. Lee, G. Ravichandran, Experimental Mechanics 42 (2002) 58-64]. Dynamic experiments were carried out using a split Hopkinson pressure bar, and the specimen's temperature was monitored throughout the tests using an infrared radiometer. The results of the mechanical tests confirm previous results on pure Ta. Specifically, in addition to its significant strain rate sensitivity, it was observed that pure Ta exhibits very little strain hardening at high strain rates. The measured temperature rise in the specimen's gauge was compared to theoretical predictions which assume a total conversion of the mechanical energy into heat (β = 1) [G.I. Taylor, H. Quinney, Proceedings of the Royal Society of London, vol. A, 1934, pp. 307-326], and an excellent agreement was obtained. This result confirms the previous result of Kapoor and Nemat-Nasser [R. Kapoor, S. Nemat-Nasser, Mech. Mater. 27 (1998) 1-12], while a different experimental approach was adopted here. The assumption that β = 1 is found to be justified in this specific case by the lack of dynamic strain hardening of pure Ta. However, this assumption should be limited to non-hardening materials, to reflect the fact that strain hardening implies that part of the mechanical energy is stored into the material's microstructure

  18. Tritium diffusion in polycrystalline lithium tungstate

    International Nuclear Information System (INIS)

    Krutyakov, A.N.; Shadrin, A.A.; Saunin, E.I.; Gromov, V.V.; Shafiev, A.I.

    1984-01-01

    Using radiometric method the investigation of tritium separation from neutron irradiated (neutron flux density 1.2x10 13 n/cm 2 xs) polycrystalline Li 2 WO 4 in the temperature range 200-680 deg C has been carried out. It is established that the use of helium as gas-carrier of flow-type gas-discharge counter permits to conduct continuous stable measurements of concentrations of tritium extracted depending on its chemical state. It is shown that volume diffusion is the process, limiting tritiated particle separation rate from Li 2 WO 4 . It is found that the process of tritium volume diffusion in Li 2 WO 4 corresponds to two different mechanisms respectively in low- (200-300 deg C) and high-temperature (350-680 deg C) ranges. A supposition is made that in the low-temperature range the process of diffusion is conditioned by the dissociation of the radiation defect-tritiated particle complex, which is confirmed by the data on radiation defect annealing in Li 2 WO 4 . The value of activation energy of tritium separation process in the range 350-680 deg C, proved to be equal to 13.3 kJ/mol. Possible role of crystal structure peculiarities of Li 2 WO 4 for diffusion process is pointed out

  19. Deformation localization and cyclic strength in polycrystalline molybdenum

    Energy Technology Data Exchange (ETDEWEB)

    Sidorov, O.T.; Rakshin, A.F.; Fenyuk, M.I.

    1983-06-01

    Conditions of deformation localization and its interrelation with cyclic strength in polycrystalline molybdenum were investigated. A fatigue failure of polycrystalline molybdenum after rolling and in an embrittled state reached by recrystallization annealing under cyclic bending at room temperature takes place under nonuniform distribution of microplastic strain resulting in a temperature rise in separate sections of more than 314 K. More intensive structural changes take place in molybdenum after rolling than in recrystallized state.

  20. Implantation of boron in silicon

    International Nuclear Information System (INIS)

    Hofker, W.K.

    1975-01-01

    The distribution versus depth of boron implanted in silicon and the corresponding electrical activity obtained after annealing are studied. The boron distributions are measured by secondary-ion mass spectrometry. Boron distributions implanted at energies in the range from 30 keV to 800 keV in amorphous and polycrystalline silicon are analysed. Moments of these distributions are determined by a curve-fitting programme and compared with moments calculated by Winterbon. Boron distributions obtained by implantations along a dense crystallographic direction in monocrystalline silicon are found to have penetrating tails. After investigation of some possible mechanisms of tail formation it is concluded that the tails are due to channelling. It was found that the behaviour of boron during annealing is determined by the properties of three boron fractions consisting of precipitated boron, interstitial boron and substitutional boron. The electrical activity of the boron versus depth is found to be consistent with the three boron fractions. A peculiar redistribution of boron is found which is induced by the implantation of a high dose of heavy ions and subsequent annealing. Different mechanisms which may cause the observed effects, such as thermal diffusion which is influenced by lattice strain and damage, are discussed. (Auth.)

  1. Surface finish and subsurface damage in polycrystalline optical materials

    Science.gov (United States)

    Shafrir, Shai Negev

    We measure and describe surface microstructure and subsurface damage (SSD) induced by microgrinding of hard metals and hard ceramics used in optical applications. We examine grinding of ceramic materials with bonded abrasives, and, specifically, deterministic microgrinding (DMG). DMG, at fixed nominal infeed rate and with bound diamond abrasive tools, is the preferred technique for optical fabrication of ceramic materials. In DMG material removal is by microcracking. DMG provides cost effective high manufacturing rates, while attaining higher strength and performance, i.e., low level of subsurface damage (SSD). A wide range of heterogeneous materials of interest to the optics industry were studied in this work. These materials include: A binderless tungsten carbide, nonmagnetic Ni-based tungsten carbides, magnetic Co-based tungsten carbides, and, in addition, other hard optical ceramics, such as aluminum oxynitride (Al23O27N5/ALON), polycrystalline alumina (Al2O3/PCA), and chemical vapor deposited (CVD) silicon carbide (Si4C/SiC). These materials are all commercially available. We demonstrate that spots taken with magnetorheological finishing (MRF) platforms can be used for estimating SSD depth induced by the grinding process. Surface morphology was characterized using various microscopy techniques, such as: contact interferometer, noncontact white light interferometer, light microscopy, scanning electron microscopy (SEM), and atomic force microscopy (AFM). The evolution of surface roughness with the amount of material removed by the MRF process, as measured within the spot deepest point of penetration, can be divided into two stages. In the first stage the induced damaged layer and associated SSD from microgrinding are removed, reaching a low surface roughness value. In the second stage we observe interaction between the MRF process and the material's microstructure as MRF exposes the subsurface without introducing new damage. Line scans taken parallel to the MR

  2. Crystalline silicon films sputtered on molybdenum A study of the silicon-molybdenum interface

    Energy Technology Data Exchange (ETDEWEB)

    Reinig, P.; Fenske, F.; Fuhs, W.; Schoepke, A.; Selle, B

    2003-04-15

    Polycrystalline silicon films were grown on molybdenum (Mo)-coated substrates at high deposition rate using the pulsed magnetron sputtering technique. Our study investigates the silicon-molybdenum interface of these films to elucidate stimulating mechanisms for an ordered crystalline silicon thin film growth. Both Auger electron spectroscopy and Rutherford backscattering reveal that at a substrate temperature as low as T{sub S}=450 deg. C during the deposition process intermixing of Si and Mo at the Si-Mo interface takes place leading to a compositional ratio Mo:Si of about 1:2. By Raman spectroscopy hexagonal {beta}-MoSi{sub 2} could be identified as the dominant phase in this intermixed region. The dependence of the resulting thickness of the reacted interface layer on the deposition conditions is not fully understood yet.

  3. Crystalline silicon films sputtered on molybdenum A study of the silicon-molybdenum interface

    International Nuclear Information System (INIS)

    Reinig, P.; Fenske, F.; Fuhs, W.; Schoepke, A.; Selle, B.

    2003-01-01

    Polycrystalline silicon films were grown on molybdenum (Mo)-coated substrates at high deposition rate using the pulsed magnetron sputtering technique. Our study investigates the silicon-molybdenum interface of these films to elucidate stimulating mechanisms for an ordered crystalline silicon thin film growth. Both Auger electron spectroscopy and Rutherford backscattering reveal that at a substrate temperature as low as T S =450 deg. C during the deposition process intermixing of Si and Mo at the Si-Mo interface takes place leading to a compositional ratio Mo:Si of about 1:2. By Raman spectroscopy hexagonal β-MoSi 2 could be identified as the dominant phase in this intermixed region. The dependence of the resulting thickness of the reacted interface layer on the deposition conditions is not fully understood yet

  4. A MONTÉ CARLO MODEL FOR SIMULATING THE NITROGEN DIFFUSION EFFECT INTO B-LPCVD-NIDOS POLYCRYSTALLINE THIN FILMS

    Directory of Open Access Journals (Sweden)

    S ALLAG

    2012-06-01

    Full Text Available The principal objective of our current work, is to study the influence of different treatment from surface which makes it possible to improve the properties of materials by technique of beam of ions (diffusion – implantation, on the distribution of the particles in a semiconductor the prone polycrystalline Silicon of our study, largely used in micro-electronics.  The interest of this study is related to the ceaseless requirements in industry for increasingly reduced, powerful materials and with the weakest possible cost price.       We thus have, makes a nitriding in gas phase during the phase of deposit LPCVD of polycrystalline Silicon, then one made an ionic implantation with the Bore ions.  The results obtained, starting from a simulation based on the Monte Carlo method, although they are carried out with amounts much lower than the really introduced amounts, being given the limitation of the machine used, satisfied the predictions established at the beginning and encourage us to continue this study from the point of view of the use of this material in particular in varied fields.

  5. IBC c-Si solar cells based on ion-implanted poly-silicon passivating contacts

    NARCIS (Netherlands)

    Yang, G.; Ingenito, A.; Isabella, O.; Zeman, M.

    2016-01-01

    Ion-implanted poly-crystalline silicon (poly-Si), in combination with a tunnel oxide layer, is investigated as a carrier-selective passivating contact in c-Si solar cells based on an interdigitated back contact (IBC) architecture. The optimized poly-Si passivating contacts enable low interface

  6. Orientation and Morphology Effects in Rapid Silicon Sheet Solidification

    Science.gov (United States)

    Ciszek, T. F.

    1984-01-01

    Radial growth anisotropies and equilibrium forms of point nucleated, dislocation free silicon sheets spreading horizontally on the free surface of a silicon melt were measured for (100), (110), (111), and (112) sheet planes. The growth process was recorded. Qualitative Wulff surface free energy polar plots were deduced from the equilibrium shapes for each sheet plane. Predicted geometries for the tip shape of unidirectional, dislocation free, horizontally grown sheets growing in various directions within the planes were analyzed. Polycrystalline sheets and dendrite propagation were analyzed. For dendrites, growth rates on the order of 2.5 m/min and growth rate anisotropies of 25 are measured.

  7. Structure and mechanical properties of the irradiated silicon

    International Nuclear Information System (INIS)

    Kalanov, M.U.; Khamraeva, R.N.; Ummatov, Kh.D.; Khajdarov, T.Kh.; Rustamova, V.M.

    2001-01-01

    In this work the results of study for radiation influence on phase content and mechanical properties of mono- and polycrystalline silicon are presented. Samples were irradiated at room temperature for 10 hours by X-quanta with mean energy 35 keV. Structural measurements were carried out on the DRON-UM1 with CuK α =1.542 Angstrom. Crystal internal friction was measurement by the ultrasonic resonance method at frequency 39 k Hz. Structure examinations show the impurity phase presence in the crystalline quartz form in the initial silicon mono- and polycrystals

  8. The influence of the mould cooling temperature on the surface appearance and the internal quality of ESR ingots

    Science.gov (United States)

    Kubin, M.; Ofner, B.; Holzgruber, H.; Schneider, R.; Enzenhofer, D.; Filzwieser, A.; Konetschnik, S.

    2016-07-01

    One of the main benefits of the ESR process is to obtain an ingot surface which is smooth and allows a subsequent forging operation without any surface dressing. The main influencing factor on surface quality is the precise controlling of the process such as melt rate and electrode immersion depth. However, the relatively strong cooling effect of water as a cooling medium can result in the solidification of the meniscus of the liquid steel on the boundary liquid steel and slag which is most likely the origin of surface defects. The usage of different cooling media like ionic liquids, a salt solution which can be heated up to 250°C operating temperature might diminish the meniscus solidification phenomenon. This paper shows the first results of the usage of an ionic liquid as a mould cooling medium. In doing so, 210mm diameter ESR ingots were produced with the laboratory scale ESR furnace at the university of applied science using an ionic liquid cooling device developed by the company METTOP. For each trial melt different inlet and outlet temperatures of the ionic liquid were chosen and the impact on the surface appearance and internal quality were analyzed. Furthermore the influence on the energy balance is also briefly highlighted. Ultimately, an effect of the usage of ionic liquids as a cooling medium could be determined and these results will be described in detail within the scope of this paper.

  9. Operating experience in processing of differently sourced deeply depleted uranium oxide and production of deeply depleted uranium metal ingots

    International Nuclear Information System (INIS)

    Manna, S.; Ladola, Y.S.; Sharma, S.; Chowdhury, S.; Satpati, S.K.; Roy, S.B.

    2009-01-01

    Uranium Metal Plant (UMP) of BARC had first time experience on production of three Depleted Uranium Metal (DUM) ingots of 76kg, 152kg and 163kg during March 1991. These ingots were produced by processing depleted uranyl nitrate solution produced at Plutonium Plant (PP), Trombay. In recent past Uranium Metal Plant (UMP), Uranium Extraction Division (UED), has been assigned to produce tonnage quantity of Deeply DUM (DDUM) from its oxide obtained from PP, PREFRE and RMP, BARC. This is required for shielding the high radioactive source of BHABHATRON Tele-cobalt machine, which is used for cancer therapy. The experience obtained in processing of various DDU oxides is being utilized for design of large scale DDU-metal plant under XIth plan project. The physico- chemical characteristics like morphology, density, flowability, reactivity, particle size distribution, which are having direct effect on reactivity of the powders of the DDU oxide powder, were studied and the shop-floor operational experience in processing of different oxide powder were obtained and recorded. During campaign trials utmost care was taken to standardized all operating conditions using the same equipment which are in use for natural uranium materials processing including safety aspects both with respect to radiological safety and industrial safety. Necessary attention and close monitoring were specially arranged and maintained for the safety aspects during the trial period. In-house developed pneumatic transport system was used for powder transfer and suitable dust arresting system was used for reduction of powder carry over

  10. Analysis and calculation of macrosegregation in a casting ingot. MPS solidification model. Volume 1: Formulation and analysis

    Science.gov (United States)

    Maples, A. L.; Poirier, D. R.

    1980-01-01

    The physical and numerical formulation of a model for the horizontal solidification of a binary alloy is described. It can be applied in an ingot. The major purpose of the model is to calculate macrosegregation in a casting ingot which results from flow of interdendritic liquid during solidification. The flow, driven by solidification contractions and by gravity acting on density gradients in the interdendritic liquid, was modeled as flow through a porous medium. The symbols used are defined. The physical formulation of the problem leading to a set of equations which can be used to obtain: (1) the pressure field; (2) the velocity field: (3) mass flow and (4) solute flow in the solid plus liquid zone during solidification is presented. With these established, the model calculates macrosegregation after solidification is complete. The numerical techniques used to obtain solution on a computational grid are presented. Results, evaluation of the results, and recommendations for future development of the model are given. The macrosegregation and flow field predictions for tin-lead, aluminum-copper, and tin-bismuth alloys are included as well as comparisons of some of the predictions with published predictions or with empirical data.

  11. Formation and properties of porous silicon layers

    International Nuclear Information System (INIS)

    Vitanov, P.; Kamenova, M.; Dimova-Malinovska, D.

    1993-01-01

    Preparation, properties and application of porous silicon films are investigated. Porous silicon structures were formed by an electrochemical etching process resulting in selective dissolution of the silicon substrate. The silicon wafers used with a resistivity of 5-10Ω.cm were doped with B to concentrations 6x10 18 -1x10 19 Ω.cm -3 in the temperature region 950 o C-1050 o C. The density of each porous films was determined from the weight loss during the anodization and it depends on the surface resistivity of the Si wafer. The density decreases with decreasing of the surface resistivity. The surface of the porous silicon layers was studied by X-ray photoelectron spectroscopy which indicates the presence of SiF 4 . The kinetic dependence of the anode potential and the porous layer thickness on the time of anodization in a galvanostatic regime for the electrolytes with various HF concentration were studied. In order to compare the properties of the resulting porous layers and to establish the dependence of the porosity on the electrolyte, three types of electrolytes were used: concentrated HF, diluted HF:H 2 O=1:1 and ethanol-hydrofluoric solutions HF:C 2 H 5 OH:H 2 O=2:1:1. High quality uniform and reproducible layers were formed using aqueous-ethanol-hydrofluoric electrolyte. Both Kikuchi's line and ring patterns were observed by TEM. The porous silicon layer was single crystal with the same orientation as the substrate. The surface shows a polycrystalline structure only. The porous silicon layers exhibit visible photoluminescence (PL) at room temperature under 480 nm Ar + laser line excitation. The peak of PL was observed at about 730 nm with FWHM about 90 nm. Photodiodes was made with a W-porous silicon junction. The current voltage and capacity voltage characteristics were similar to those of an isotype heterojunction diode. (orig.)

  12. Optimization of heat transfer during the directional solidification process of 1600 kg silicon feedstock

    Science.gov (United States)

    Hu, Chieh; Chen, Jyh Chen; Nguyen, Thi Hoai Thu; Hou, Zhi Zhong; Chen, Chun Hung; Huang, Yen Hao; Yang, Michael

    2018-02-01

    In this study, the power ratio between the top and side heaters and the moving velocity of the side insulation are designed to control the shape of the crystal-melt interface during the growth process of a 1600 kg multi-crystalline silicon ingot. The power ratio and insulation gap are adjusted to ensure solidification of the melt. To ensure that the crystal-melt interface is slightly convex in relation to the melt during the entire solidification process, the power ratio should be augmented gradually in the initial stages while being held to a constant value in the middle stages. Initially the gap between the side and the bottom insulation is kept small to reduce thermal stress inside the seed crystals. However, the growth rate will be slow in the early stages of the solidification process. Therefore, the movement of the side insulation is fast in the initial stages but slower in the middle stages. In the later stages, the side insulation gap is fixed. With these modifications, the convexity of the crystal-melt interface in relation to the melt can be maintained during the growth process with an approximately 41% reduction in the thermal stress inside the growing ingot and an 80% reduction in dislocation density along the center line of the ingot compared with the original case.

  13. Magnetic flow control in growth and casting of photovoltaic silicon: Numerical and experimental results

    Science.gov (United States)

    Poklad, A.; Pal, J.; Galindo, V.; Grants, I.; Heinze, V.; Meier, D.; Pätzold, O.; Stelter, M.; Gerbeth, G.

    2017-07-01

    A novel, vertical Bridgman-type technique for growing multi-crystalline silicon ingots in an induction furnace is described. In contrast to conventional growth, a modified setup with a cone-shaped crucible and susceptor is used. A detailed numerical simulation of the setup is presented. It includes a global thermal simulation of the furnace and a local simulation of the melt, which aims at the influence of the melt flow on the temperature and concentration fields. Furthermore, seeded growth of cone-shaped Si ingots using either a monocrystalline seed or a seed layer formed by pieces of poly-Si is demonstrated and compared to growth without seeds. The influences of the seed material on the grain structure and the dislocation density of the ingots are discussed. The second part addresses model experiments for the Czochralski technique using the room temperature liquid metal GaInSn. The studies were focused on the influence of a rotating and a horizontally static magnetic field on the melt flow and the related heat transport in crucibles being heated from bottom and/or side, and cooled by a crystal model covering about 1/3 of the upper melt surface.

  14. The characterization of high quality multicrystalline silicon by the electron beam induced current method

    International Nuclear Information System (INIS)

    Chen, J; Sekiguchi, T; Nara, S; Yang, D

    2004-01-01

    Multicrystalline silicon (mc-Si) manufactured by a multi-stage solidification control casting method has been characterized by the electron beam induced current (EBIC) method. The average diffusion length of the ingot was over 250 μm, which was much longer than that of conventional mc-Si. The EBIC study revealed that the electrical activities of grain boundaries (GBs) varied with the ingot position due to the impurity contamination level. The main impurity detected was iron. The concentration of iron in the central position was much lower than that at the bottom and top positions. GBs in the central position showed no significant EBIC contrast at 300 K, suggesting low contamination level. GBs in the top and bottom positions, however, showed strong EBIC contrast at 300 K, suggesting high contamination level. At 100 K, a denuded zone with bright contrast developed around GBs in the top and bottom positions. The existence of the denuded zone suggested that impurities were gettered at the GBs. It was considered that the variation of the diffusion length in the ingot was related to the variation of recombination activities of GBs in the different positions, which mainly depended on the impurity contamination

  15. Ge-Si single crystal growth when the begining of an ingot prepared by a new method is used as the begining of the feeding alloy

    International Nuclear Information System (INIS)

    Tahirov, V.I.; Quliyev, A.F.; Hasanov, Z.Y.; Qahramanov, N.F.

    2008-01-01

    Ge-Si system is used to describe binary solid solution single crystal growth when the beginning of the ingot prepared by a new method is used as the beginning of the feeding alloy. At first the feeding ingot is prepared by Bridgman method, then it is exposed to the zone melting. Content distribution of the feeding alloy and the grown crystal is determined by solving the continuity equation. The crystals grown by this method can be used for construction of the vary-zone structures

  16. Atomistic modeling of mechanical properties of polycrystalline graphene

    International Nuclear Information System (INIS)

    Mortazavi, Bohayra; Cuniberti, Gianaurelio

    2014-01-01

    We performed molecular dynamics (MD) simulations to investigate the mechanical properties of polycrystalline graphene. By constructing molecular models of ultra-fine-grained graphene structures, we studied the effect of different grain sizes of 1–10 nm on the mechanical response of graphene. We found that the elastic modulus and tensile strength of polycrystalline graphene decrease with decreasing grain size. The calculated mechanical proprieties for pristine and polycrystalline graphene sheets are found to be in agreement with experimental results in the literature. Our MD results suggest that the ultra-fine-grained graphene structures can show ultrahigh tensile strength and elastic modulus values that are very close to those of pristine graphene sheets. (papers)

  17. Polycrystalline Materials as a Cold Neutron and Gamma Radiation Filter

    International Nuclear Information System (INIS)

    Habib, N.

    2009-01-01

    The total neutron cross-section of polycrystalline beryllium, graphite and iron has been calculated beyond their cut-off wavelength using a general formula. The computer Cold Filter code was developed in order to provide the required calculations. The code also permits the calculation of attenuation of reactor gamma radiation, The calculated neutron transmissions through polycrystalline Be graphite and iron at different temperatures were compared with the experimental data measured at the ETRR-1 reactor using two TOF spectrometers. An overall agreement is obtained between the formula fits and experimental data at different temperatures. A feasibility study is carried on using polycrystalline Be, graphite and iron an efficient filter for cold neutrons and gamma radiation.

  18. Atomistic modeling of mechanical properties of polycrystalline graphene.

    Science.gov (United States)

    Mortazavi, Bohayra; Cuniberti, Gianaurelio

    2014-05-30

    We performed molecular dynamics (MD) simulations to investigate the mechanical properties of polycrystalline graphene. By constructing molecular models of ultra-fine-grained graphene structures, we studied the effect of different grain sizes of 1-10 nm on the mechanical response of graphene. We found that the elastic modulus and tensile strength of polycrystalline graphene decrease with decreasing grain size. The calculated mechanical proprieties for pristine and polycrystalline graphene sheets are found to be in agreement with experimental results in the literature. Our MD results suggest that the ultra-fine-grained graphene structures can show ultrahigh tensile strength and elastic modulus values that are very close to those of pristine graphene sheets.

  19. Correlation between impurities, defects and cell performance in semicrystalline silicon

    International Nuclear Information System (INIS)

    Doolittle, W.A.; Rohatgi, A.

    1990-01-01

    This paper reports that an in-depth analysis of Solarex CDS semicrystalline silicon has been performed and correlations between the efficiency and impurities, and defects present in the material have been made. Comparisons were made between cell performance and variations in interstitial oxygen, substitutional carbon, grain size, etch pit density, and trap location as a function of position in the ingot. The oxygen concentration was found to decrease with increasing distance from the bottom of the ingot while the carbon concentration as well as average grain size was found to increase. The best cell performance was obtained on wafers with minimum oxygen and maximum carbon (top). No correlation was found between etch pit density and cell performance. DLTS and JVT measurements revealed that samples with higher oxygen content (bottom) gave lower cell performance due to a large number of distributed states, possibly due to extended defects like oxygen precipitates. Low oxygen samples (top) showed predominately discrete states, improved cell performance and a doping dependent average trap density

  20. Silicon Qubits

    Energy Technology Data Exchange (ETDEWEB)

    Ladd, Thaddeus D. [HRL Laboratories, LLC, Malibu, CA (United States); Carroll, Malcolm S. [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

    2018-02-28

    Silicon is a promising material candidate for qubits due to the combination of worldwide infrastructure in silicon microelectronics fabrication and the capability to drastically reduce decohering noise channels via chemical purification and isotopic enhancement. However, a variety of challenges in fabrication, control, and measurement leaves unclear the best strategy for fully realizing this material’s future potential. In this article, we survey three basic qubit types: those based on substitutional donors, on metal-oxide-semiconductor (MOS) structures, and on Si/SiGe heterostructures. We also discuss the multiple schema used to define and control Si qubits, which may exploit the manipulation and detection of a single electron charge, the state of a single electron spin, or the collective states of multiple spins. Far from being comprehensive, this article provides a brief orientation to the rapidly evolving field of silicon qubit technology and is intended as an approachable entry point for a researcher new to this field.

  1. Nucleation and growth of polycrystalline SiC

    DEFF Research Database (Denmark)

    Kaiser, M.; Schimmel, S.; Jokubavicius, V.

    2014-01-01

    The nucleation and bulk growth of polycrystalline SiC in a 2 inch PVT setup using isostatic and pyrolytic graphite as substrates was studied. Textured nucleation occurs under near-thermal equilibrium conditions at the initial growth stage with hexagonal platelet shaped crystallites of 4H, 6H and 15......R polytypes. It is found that pyrolytic graphite results in enhanced texturing of the nucleating gas species. Reducing the pressure leads to growth of the crystallites until a closed polycrystalline SiC layer containing voids with a rough surface is developed. Bulk growth was conducted at 35 mbar Ar...

  2. Software optimization for electrical conductivity imaging in polycrystalline diamond cutters

    Energy Technology Data Exchange (ETDEWEB)

    Bogdanov, G.; Ludwig, R. [Department of Electrical and Computer Engineering, Worcester Polytechnic Institute, 100 Institute Rd, Worcester, MA 01609 (United States); Wiggins, J.; Bertagnolli, K. [US Synthetic, 1260 South 1600 West, Orem, UT 84058 (United States)

    2014-02-18

    We previously reported on an electrical conductivity imaging instrument developed for measurements on polycrystalline diamond cutters. These cylindrical cutters for oil and gas drilling feature a thick polycrystalline diamond layer on a tungsten carbide substrate. The instrument uses electrical impedance tomography to profile the conductivity in the diamond table. Conductivity images must be acquired quickly, on the order of 5 sec per cutter, to be useful in the manufacturing process. This paper reports on successful efforts to optimize the conductivity reconstruction routine, porting major portions of it to NVIDIA GPUs, including a custom CUDA kernel for Jacobian computation.

  3. Development of surface relief on polycrystalline metals due to sputtering

    Energy Technology Data Exchange (ETDEWEB)

    Voitsenya, V.S. [IPP NSC KIPT, 61108 Kharkov (Ukraine); Balden, M. [Max-Planck-Institut für Plasmaphysik, EURATOM Association, Garching (Germany); Bardamid, A.F. [Taras Shevchenko National University, 01033 Kiev (Ukraine); Bondarenko, V.N. [IPP NSC KIPT, 61108 Kharkov (Ukraine); Davis, J.W., E-mail: jwdavis@starfire.utias.utoronto.ca [University of Toronto Institute for Aerospace Studies, 4925 Dufferin St., Toronto, ON, Canada M3H5T6 (Canada); Konovalov, V.G.; Ryzhkov, I.V.; Skoryk, O.O.; Solodovchenko, S.I. [IPP NSC KIPT, 61108 Kharkov (Ukraine); Zhang-jian, Zhou [University of Science and Technology Beijing, Beijing 100 083 (China)

    2013-05-01

    The characteristics of surface microrelief that appear in sputtering experiments with polycrystalline metals of various grain sizes have been studied. Specimens with grain sizes varying from 30–70 nm in the case of crystallized amorphous alloys, to 1–3 μm for technical tungsten grade and 10–100 μm for recrystallized tungsten were investigated. A model is proposed for the development of roughness on polycrystalline metals which is based on the dependence of sputtering rate on crystal orientation. The results of the modeling are in good agreement with experiments showing that the length scale of roughness is much larger than the grain size.

  4. Report on achievements in fiscal 1999 on research and development of immediately effective and innovative energy environment technology. Part 1. Development of immediately effective and high-efficiency solar cells, and development of technology to slice and manufacture thin-type large-area polycrystalline substrates; 1999 nendo sokkoteki kakushinteki energy kankyo gijutsu kenkyu kaihatsu seika hokokusho. Sokkogata kokoritsu taiyo denchi gijutsu kaihatsu (usugata daimenseki takessho kiban slice seizo gijutsu kaihatsu 1)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2000-03-01

    With an objective of decreasing silicon usage quantity for the purpose of reducing the solar cell production cost, development is being performed on an ingot cutting technology to cut a silicon ingot to Kerf loss of 150 {mu} m and thickness of 150 {mu} m, and in which the produced wafers can withstand the cell making. Investigations revealed that a wire saw is suitable as the cutting system, and the wire used must have a diameter of less than 120 {mu} m, and a strength of more than 3850 N/mm{sup 2}. A prototype wire was fabricated, whose diameter is 120 {mu} m, and in which the strength is distributed between 3870 and 4110 N/mm{sup 2}. It was found possible that a wire of 160 {mu} m can be used to slice an ingot having a cross section surface of 150 mm square and a length of 300 mm into a slice having a Kerf loss of 200 {mu} m and a thickness of 180 {mu} m. This wafer had the in-plane distribution of the substrate thickness at {+-} 12.5 {mu}, swell of 120 {mu} at maximum, and surface roughness of 5 {mu}. Making ten of these wafers into a cell resulted in a yield of 60%. Assignments are the clarification of the properties of the cutting wire, the preparation of a thin wire with homogeneous quality, and the establishment of a technology to cut Kerf loss of 150 {mu} and substrate thickness of 150 {mu}. (NEDO)

  5. The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light

    DEFF Research Database (Denmark)

    Ludwig, W.; King, A.; Herbig, M.

    2011-01-01

    The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light Synchrotron radiation X-ray imaging and diffraction techniques offer new possibilities for non-destructive bulk characterization of polycrystalline materials. Minute changes in electron density (diff...

  6. Carrier Transport, Recombination, and the Effects of Grain Boundaries in Polycrystalline Cadmium Telluride Thin Films for Photovoltaics

    Science.gov (United States)

    Tuteja, Mohit

    Cadmium Telluride (CdTe), a chalcogenide semiconductor, is currently used as the absorber layer in one of the highest efficiency thin film solar cell technologies. Current efficiency records are over 22%. In 2011, CdTe solar cells accounted for 8% of all solar cells installed. This is because, in part, CdTe has a low degradation rate, high optical absorption coefficient, and high tolerance to intrinsic defects. Solar cells based on polycrystalline CdTe exhibit a higher short-circuit current, fill factor, and power conversion efficiency than their single crystal counterparts. This is despite the fact that polycrystalline CdTe devices exhibit lower open-circuit voltages. This is contrary to the observation for silicon and III-V semiconductors, where material defects cause a dramatic drop in device performance. For example, grain boundaries in covalently-bonded semiconductors (a) act as carrier recombination centers, and (b) lead to localized energy states, causing carrier trapping. Despite significant research to date, the mechanism responsible for the superior current collection properties of polycrystalline CdTe solar cells has not been conclusively answered. This dissertation focuses on the macro-scale electronic band structure, and micro scale electronic properties of grains and grain boundaries in device-grade CdTe thin films to answer this open question. My research utilized a variety of experimental techniques. Samples were obtained from leading groups fabricating the material and devices. A CdCl 2 anneal is commonly performed as part of this fabrication and its effects were also investigated. Photoluminescence (PL) spectroscopy was employed to study the band structure and defect states in CdTe polycrystals. Cadmium vacancy- and chlorine-related states lead to carrier recombination, as in CdTe films grown by other methods. Comparing polycrystalline and single crystal CdTe, showed that the key to explaining the improved performance of polycrystalline CdTe does

  7. Slag inclusions in vacuum-melted ingots of the KhN73MBTYu nickel base alloy

    International Nuclear Information System (INIS)

    Gorin, V.A.; Kleshchev, A.S.; Kazharskaya, L.P.

    1977-01-01

    Three types of slag inclusions in ingots of the vacuum-arc-remelted nickel alloy KhN73MBTYu are considered. Type 1 inclusions are those in the surface zone; type 2 inclusions are agglomerations of nitrides and oxides formed due to the fall of lining slag; type 3 inclusions consist of agglomerations of nitrides and oxides as a result of interaction of dissolved oxygen and nitrogen with melt components. The inclusions are removed by machining of the lateral surface. It should be noted that the presence of a large amount of slag on the surface of the molten pool adversely affects the stability of the electrical regime of melting. Strict adherence to the recommendations on the melting and pouring of the initial metal reduces the pollution of the consumable electrode with nonmetallic inclusions

  8. Electrical Transport Properties of Polycrystalline Monolayer Molybdenum Disulfide

    Science.gov (United States)

    2014-07-14

    Lou, Sina Najmaei, Matin Amani, Matthew L. Chin, Zheng Se. TASK NUMBER Liu Sf. WORK UNIT NUMBER 7. PERFORMING ORGANIZATION NAMES AND ADDRESSES 8...Transport Properties of Polycrystalline Monolayer Molybdenum Disulfide Sina Najmaei,t.§ Matin Ama ni,M Matthew L. Chin,* Zhe ng liu/ ·"·v: A. Gle n

  9. Electroreduction of CO on Polycrystalline Copper at Low Overpotentials

    DEFF Research Database (Denmark)

    Bertheussen, Erlend; Vagn Hogg, Thomas; Abghoui, Younes

    2018-01-01

    C uis the only monometallic electrocatalyst to produce highly reduced products from CO2 selectively because of its intermediate binding of CO. We investigate the performance of polycrystalline Cu for the electroreduction of CO in alkaline media (0.1 M KOH) at low overpotentials (−0.4 to −0.6 V vs...

  10. A study of ultrasonic velocity and attenuation on polycrystalline Ni ...

    Indian Academy of Sciences (India)

    Unknown

    tion of Fe3O4 particles at 800°C. Industrial grade particles of Ni and Zn oxides were ..... domain wall movements, which leads to electronic migrations: this can ... properties of polycrystalline Mn–Zn Ferrites, Ph.D. Thesis,. Osmania University ...

  11. Influence of hydrogen on high cycle fatigue of polycrystalline vanadium

    International Nuclear Information System (INIS)

    Chung, D.W.; Lee, K.S.; Stoloff, N.S.

    1977-02-01

    The room temperature fatigue behavior of several polycrystalline V-H 2 alloys is described. Hydrogen extends the life of unnotched vanadium but has a deleterious effect in notched materials. Crack propagation data are correlated with tensile yield stress and cyclic strain hardening data

  12. A review of recent progress in heterogeneous silicon tandem solar cells

    Science.gov (United States)

    Yamaguchi, Masafumi; Lee, Kan-Hua; Araki, Kenji; Kojima, Nobuaki

    2018-04-01

    Silicon solar cells are the most established solar cell technology and are expected to dominate the market in the near future. As state-of-the-art silicon solar cells are approaching the Shockley-Queisser limit, stacking silicon solar cells with other photovoltaic materials to form multi-junction devices is an obvious pathway to further raise the efficiency. However, many challenges stand in the way of fully realizing the potential of silicon tandem solar cells because heterogeneously integrating silicon with other materials often degrades their qualities. Recently, above or near 30% silicon tandem solar cell has been demonstrated, showing the promise of achieving high-efficiency and low-cost solar cells via silicon tandem. This paper reviews the recent progress of integrating solar cell with other mainstream solar cell materials. The first part of this review focuses on the integration of silicon with III-V semiconductor solar cells, which is a long-researched topic since the emergence of III-V semiconductors. We will describe the main approaches—heteroepitaxy, wafer bonding and mechanical stacking—as well as other novel approaches. The second part introduces the integration of silicon with polycrystalline thin-film solar cells, mainly perovskites on silicon solar cells because of its rapid progress recently. We will also use an analytical model to compare the material qualities of different types of silicon tandem solar cells and project their practical efficiency limits.

  13. CdCl2 passivation of polycrystalline CdMgTe and CdZnTe absorbers for tandem photovoltaic cells

    Science.gov (United States)

    Swanson, Drew E.; Reich, Carey; Abbas, Ali; Shimpi, Tushar; Liu, Hanxiao; Ponce, Fernando A.; Walls, John M.; Zhang, Yong-Hang; Metzger, Wyatt K.; Sampath, W. S.; Holman, Zachary C.

    2018-05-01

    As single-junction silicon solar cells approach their theoretical limits, tandems provide the primary path to higher efficiencies. CdTe alloys can be tuned with magnesium (CdMgTe) or zinc (CdZnTe) for ideal tandem pairing with silicon. A II-VI/Si tandem holds the greatest promise for inexpensive, high-efficiency top cells that can be quickly deployed in the market using existing polycrystalline CdTe manufacturing lines combined with mature silicon production lines. Currently, all high efficiency polycrystalline CdTe cells require a chloride-based passivation process to passivate grain boundaries and bulk defects. This research examines the rich chemistry and physics that has historically limited performance when extending Cl treatments to polycrystalline 1.7-eV CdMgTe and CdZnTe absorbers. A combination of transmittance, quantum efficiency, photoluminescence, transmission electron microscopy, and energy-dispersive X-ray spectroscopy clearly reveals that during passivation, Mg segregates and out-diffuses, initially at the grain boundaries but eventually throughout the bulk. CdZnTe exhibits similar Zn segregation behavior; however, the onset and progression is localized to the back of the device. After passivation, CdMgTe and CdZnTe can render a layer that is reduced to predominantly CdTe electro-optical behavior. Contact instabilities caused by inter-diffusion between the layers create additional complications. The results outline critical issues and paths for these materials to be successfully implemented in Si-based tandems and other applications.

  14. Microscopic study of the H.sub.2./sub.O vapor treatment of the silicon grain boundaries

    Czech Academy of Sciences Publication Activity Database

    Honda, Shinya; Mates, Tomáš; Rezek, Bohuslav; Fejfar, Antonín; Kočka, Jan

    2008-01-01

    Roč. 354, č. 19-25 (2008), s. 2310-2313 ISSN 0022-3093 R&D Projects: GA MŽP(CZ) SN/3/172/05 Keywords : polycrystalline silicon films * H 2 O vapor treatment * potential * crystalline disorder * stress * defects * passivation Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.449, year: 2008

  15. Polycrystalline dosimetric discs of natural CaF2

    International Nuclear Information System (INIS)

    Okuno, E.; Ferreira, M.M.; Cruz, M.T.; Watanabe, S.

    1977-01-01

    A new method to prepare TL dosimeters in solid discs form, by the application of cold press in a mixture of KCL and fluorite in powder form, is investigated. By this method, it is possible to obtain thousands of dosimeters without difficulty much more uniform than that obtained from monocrystal ingots. The results show that the new dosimeters present the same properties as the fluorite in powder form, with the advantage that it is easier to handle in routine work. The ratio of 2 to 1 for KCL mass to CaF 2 mass presents good Tl sensitivity to ionizing radiation and sufficient mechanical resistivity. The minimum detectable exposure is approximately 10 mR. 83% from 442 CaF 2 solid discs gave TL response within 10% of mean value. Energy dependence is also presented [pt

  16. Randomized controlled trial assessing the efficacy of a reusable fish-shaped iron ingot to increase hemoglobin concentration in anemic, rural Cambodian women.

    Science.gov (United States)

    Rappaport, Aviva I; Whitfield, Kyly C; Chapman, Gwen E; Yada, Rickey Y; Kheang, Khin Meng; Louise, Jennie; Summerlee, Alastair J; Armstrong, Gavin R; Green, Timothy J

    2017-08-01

    Background: Anemia affects 45% of women of childbearing age in Cambodia. Iron supplementation is recommended in populations in which anemia prevalence is high. However, there are issues of cost, distribution, and adherence. A potential alternative is a reusable fish-shaped iron ingot, which, when added to the cooking pot, leaches iron into the fluid in which it is prepared. Objective: We sought to determine whether there was a difference in hemoglobin concentrations in rural Cambodian anemic women (aged 18-49 y) who cooked with the iron ingot or consumed a daily iron supplement compared with a control after 1 y. Design: In Preah Vihear, 340 women with mild or moderate anemia were randomly assigned to 1 ) an iron-ingot group, 2 ) an iron-supplement (18 mg/d) group, or 3 ) a nonplacebo control group. A venous blood sample was taken at baseline and at 6 and 12 mo. Blood was analyzed for hemoglobin, serum ferritin, and serum transferrin receptor. Hemoglobin electrophoresis was used to detect structural hemoglobin variants. Results: Anemia prevalence was 44% with the use of a portable hemoglobinometer during screening. At baseline, prevalence of iron deficiency was 9% on the basis of a low serum ferritin concentration. There was no significant difference in mean hemoglobin concentrations between the iron-ingot group (115 g/L; 95% CI: 113, 118 g/L; P = 0.850) or iron-supplement group (115 g/L; 95% CI: 113, 117 g/L; P = 0.998) compared with the control group (115 g/L; 95% CI: 113, 117 g/L) at 12 mo. Serum ferritin was significantly higher in the iron-supplement group (73 μg/L; 95% CI: 64, 82 μg/L; P = 0.002) than in the control group at 6 mo; however, this significance was not maintained at 12 mo (73 μg/L; 95% CI: 58, 91 μg/L; P = 0.176). Conclusions: Neither the iron ingot nor iron supplements increased hemoglobin concentrations in this population at 6 or 12 mo. We do not recommend the use of the fish-shaped iron ingot in Cambodia or in countries where the prevalence

  17. Development of the irradiation facilities for silicon neutron doping in France

    International Nuclear Information System (INIS)

    Breant, P.; Cherruau, F.; Genthon, J.P.

    1980-08-01

    Irradiation facilities for silicon irradiations in France may be classified in two categories: on the one hand the devices directly implemented in the light water of α swimming-pool reactor and on the other hand the devices implemented in a neutronic medium -heavy water here- providing a high value of the thermal to fast neutron flux ratio. The tools used in France for silicon neutron doping are recapitulated according to this classification in tables, with their main characteristics; in addition it is specified that all existing facilities are instrumented with ingot rotation, flux monitoring, automatic time integration and are associated with handling, storage, cleaning, decontamination and activity control equipment. Finally, concerning the irradiation capacities given in these tables, it is pointed out that they are realistic and present capacities, for presently running devices and according to the way they are used on an average; that is to say that they take into account the real average dimensions of the ingot supplied and not the maximum possible loading with the maximum diameters. Further extensions of capacity are possible if need be by the installation of supplementary standard irradiation modules in the pools. Particular attention will given to the new developments: -new irradiaton facilities with a high Oth/Or ratio being developed in the new research reactor ORPHEE: - developments in the OSIRIS H 2 O reactor. In particular and in connection with the facilities developped in OSIRIS, neutronic problems typical and swimming-pool reactors will be contemplated and the adopted solutions given

  18. Transport charge of gallium arsenide films synthesized on polycrystalline silicon by ion ablation

    International Nuclear Information System (INIS)

    Kabyshev, A V; Konusov, F V; Remnev, G E; Pavlov, S K

    2014-01-01

    Electrophysical and photoelectric properties of thin GaAs films deposited on polysilicon by pulse ion ablation using high-power ion beams have been investigated. The predominant charge carriers transfer mechanism in films and the type of dark and photoconductivity have been established. A vacuum annealing effect (10 −2 Pa, 300-1000 K) on energetic and kinetic characteristics of dark and photoconductivity, the transfer mechanism and the type of charge carriers have been determined. The most probable causes of changes in the film electric and photoelectric characteristics have been discussed

  19. Phosphorus Doping Using Electron Cyclotron Resonance Plasma for Large-Area Polycrystalline Silicon Thin Film Transistors

    Science.gov (United States)

    Kakinuma, Hiroaki; Mohri, Mikio; Tsuruoka, Taiji

    1994-01-01

    We have investigated phosphorus doping using an electron cyclotron resonance (ECR) plasma, for application to the poly-Si driving circuits of liquid crystal displays or image sensors. The PH3/He was ionized and accelerated to poly-Si and c-Si substrates with a self bias of -220 V. The P concentration, as detected by secondary ion mass spectroscopy (SIMS), is ˜5×1021 cm-3 at the surface, which decayed to ˜1017 cm-3 within 50 100 nm depth. The surface is found to be etched during doping. The etching is restored by adding a small amount of SiH4 and the sheet resistance R s decreases. The optimized as-irradiated R s is ˜ 1× 105 Ω/\\Box and 1.7× 102 Ω/\\Box for poly-Si and (110) c-Si, respectively. The dependence of R s on the substrates and the anomalous diffusion constants derived from SIMS are also discussed.

  20. Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate

    Czech Academy of Sciences Publication Activity Database

    Ogane, A.; Honda, Shinya; Uraoka, Y.; Fuyuki, T.; Fejfar, Antonín; Kočka, Jan

    2009-01-01

    Roč. 311, č. 3 (2009), s. 789-793 ISSN 0022-0248 Institutional research plan: CEZ:AV0Z10100521 Keywords : crystallites * defects * chemical vapor deposition processes * solar cells Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.534, year: 2009

  1. Epitaxially grown polycrystalline silicon thin-film solar cells on solid-phase crystallised seed layers

    Energy Technology Data Exchange (ETDEWEB)

    Li, Wei, E-mail: weili.unsw@gmail.com; Varlamov, Sergey; Xue, Chaowei

    2014-09-30

    Highlights: • Crystallisation kinetic is used to analyse seed layer surface cleanliness. • Simplified RCA cleaning for the seed layer can shorten the epitaxy annealing duration. • RTA for the seed layer can improve the quality for both seed layer and epi-layer. • Epitaxial poly-Si solar cell performance is improved by RTA treated seed layer. - Abstract: This paper presents the fabrication of poly-Si thin film solar cells on glass substrates using seed layer approach. The solid-phase crystallised P-doped seed layer is not only used as the crystalline template for the epitaxial growth but also as the emitter for the solar cell structure. This paper investigates two important factors, surface cleaning and intragrain defects elimination for the seed layer, which can greatly influence the epitaxial grown solar cell performance. Shorter incubation and crystallisation time is observed using a simplified RCA cleaning than the other two wet chemical cleaning methods, indicating a cleaner seed layer surface is achieved. Cross sectional transmission microscope images confirm a crystallographic transferal of information from the simplified RCA cleaned seed layer into the epi-layer. RTA for the SPC seed layer can effectively eliminate the intragrain defects in the seed layer and improve structural quality of both of the seed layer and the epi-layer. Consequently, epitaxial grown poly-Si solar cell on the RTA treated seed layer shows better solar cell efficiency, V{sub oc} and J{sub sc} than the one on the seed layer without RTA treatment.

  2. Correlation analysis of heat flux and fire behaviour and hazards of polycrystalline silicon photovoltaic panels

    Science.gov (United States)

    Ju, Xiaoyu; Zhou, Xiaodong; Peng, Fei; Wu, Zhibo; Lai, Dimeng; Hu, Yue; Yang, Lizhong

    2017-05-01

    This work aims to gain a better understanding of fire behaviour and hazards of PV panels under different radiation heat fluxes. The cone calorimeter tests were applied to simulate the situations when the front and back surfaces are exposed to heat flux in a fire, respectively. Through comparison of ignition time, mass loss rate and heat release rate, it is found that the back-up condition is more hazardous than face-up condition. Meanwhile, three key parameters: flashover propensity, total heat release and FED, were introduced to quantitatively illustrate fire hazards of a PV panel.

  3. Fabrication of poly-crystalline Si-based Mie resonators via amorphous Si on SiO2 dewetting.

    Science.gov (United States)

    Naffouti, Meher; David, Thomas; Benkouider, Abdelmalek; Favre, Luc; Ronda, Antoine; Berbezier, Isabelle; Bidault, Sebastien; Bonod, Nicolas; Abbarchi, Marco

    2016-02-07

    We report the fabrication of Si-based dielectric Mie resonators via a low cost process based on solid-state dewetting of ultra-thin amorphous Si on SiO2. We investigate the dewetting dynamics of a few nanometer sized layers annealed at high temperature to form submicrometric Si-particles. Morphological and structural characterization reveal the polycrystalline nature of the semiconductor matrix as well as rather irregular morphologies of the dewetted islands. Optical dark field imaging and spectroscopy measurements of the single islands reveal pronounced resonant scattering at visible frequencies. The linewidth of the low-order modes can be ∼20 nm in full width at half maximum, leading to a quality factor Q exceeding 25. These values reach the state-of-the-art ones obtained for monocrystalline Mie resonators. The simplicity of the dewetting process and its cost-effectiveness opens the route to exploiting it over large scales for applications in silicon-based photonics.

  4. Multi-material gate poly-crystalline thin film transistors: Modeling and simulation for an improved gate transport efficiency

    International Nuclear Information System (INIS)

    Sehgal, Amit; Mangla, Tina; Gupta, Mridula; Gupta, R.S.

    2008-01-01

    In this work, a two-dimensional potential distribution formulation is presented for multi-material gate poly-crystalline silicon thin film transistors. The developed formulation incorporates the effects due to traps and grain-boundaries. In short-channel devices, short-channel effects and drain-induced barrier lowering (DIBL) effect exists, and are accounted for in the analysis. The work aims at the reduction of DIBL effect and grain-boundary effects i.e. to reduce the potential barriers generated in the channel by employing gate-engineered structures. A study of work-functions and electrode lengths of multi-material gate electrode is done to suppress the potential barriers, hot electron effect and to improve the carrier transport efficiency. Green's function approach is adopted for the two-dimensional potential solution. The results obtained show a good agreement with simulated results, thus, demonstrating the validity of our model

  5. Some data of second sequence non standard austenitic ingot, A2

    International Nuclear Information System (INIS)

    Nurdin Effendi; Aziz K Jahja; Bandriana; Wisnu Ari Adi

    2012-01-01

    Synthesis of second sequence austenite stainless steel named A2 using extracted minerals from Indonesian mines has been carried out. The starting materials for austenite alloy consist of granular ferro scrap, nickel, ferro-chrome, ferro-manganese, and ferro-silicon. The second sequence composition differs from the former first sequence. This A2 sequence contained more nickel, meanwhile titanium element had not been added explicitly to it, and just been found from raw materials contents or impurities, as well as carbon content in the alloy. However before the actual alloying work started, the first important step was to carry out the determination of the fractional amount of each starting material necessary to form an austenite stainless steel alloy as specified. Once the component fraction of each base alloy-element was determined, the raw materials are weighed on the mini-balance. After the fractional quantities of each constituent have been computed, an appropriate amount of these base materials are weighed separately on the micro scale. The raw materials were then placed in the induction foundry furnace, which was operated by an electromagnetic inductive-thermal system. The foundry furnace system performs the stirring of the molten materials automatically. The homogenized molten metals were poured down into sand casting prepared in advance. Some of the austenite stainless steel were normalized at 600°C for 6 hours. The average density is 7.8 g cm -1 and the average hardness value of 'normalized' austenite stainless-steels is in the range of 460 on the Vickers scale. The microstructure observation concludes that an extensive portion of the sample's structure is dendritic and the surface turns out to be homogenous. X-ray diffraction analysis shows that the material belongs to the fcc crystallographic system, which fits in with the austenite class of the alloy. The experimental fractional elemental composition data acquired by OES method turn out to

  6. Zero and low coefficient of thermal expansion polycrystalline oxides

    International Nuclear Information System (INIS)

    Skaggs, S.R.

    1977-09-01

    Polycrystalline oxide systems with zero to low coefficient of thermal expansion (CTE) investigated by the author include hafnia-titania and hafnia. The CTE for 30 to 40 mol% TiO 2 in HfO 2 is less than or equal to 1 x 10 -6 / 0 C, while for other compositions in the range 25 to 60 mol% it is approximately 4 x 10 -6 / 0 C. An investigation of the CTE of 99.999% HfO 2 yielded a value of 4.6 x 10 -6 / 0 C from room temperature to 1000 0 C. Correlation with data on HfO 2 by other investigators shows a definite relationship between the CTE and the amount of ZrO 2 present. Data are listed for comparison of the CTE of several other polycrystalline oxides investigated by Holcombe at Oak Ridge

  7. Zero and low coefficient of thermal expansion polycrystalline oxides

    International Nuclear Information System (INIS)

    Skaggs, S.R.

    1977-01-01

    Polycrystalline oxide systems with zero to low coefficient of thermal expansion (CTE) investigated by the author include hafnia-titania and hafnia. The CTE for 30 to 40 mol percent TiO 2 in HfO 2 is less than or equal to 1 x 10 -6 / 0 C, while for other compositions in the range 25 to 60 mol percent approximately 4 x 10 -6 / 0 C. An investigation of the CTE of 99.999 percent HfO 2 yielded a value of 4.6 x 10 -6 / 0 C from room temperature to 1000 0 C. Correlation with data on HfO 2 by other investigators shows a definite relationship between the CTE and the amount of ZrO 2 present. Data are listed for comparison of the CTE of several other polycrystalline oxides investigated by Holcombe at Oak Ridge

  8. Surface Potential of Polycrystalline Hematite in Aqueous Medium

    Directory of Open Access Journals (Sweden)

    Tajana Preočanin

    2011-01-01

    Full Text Available The surface potential of polycrystalline hematite in aqueous sodium perchlorate environment as a function of pH was examined. Surface potential of hematite was obtained from measured electrode potential of a nonporous polycrystalline hematite electrode. Acidic solution was titrated with base, and the backward titration with acid was performed. Substantial hysteresis was obtained which enabled location of the point of zero potential and equilibrium values of surface potentials. The theoretical interpretation of the equilibrium data was performed by applying the surface complexation model and the thermodynamic equilibrium constants for the first and the second step of surface protonation was obtained as logK1∘=11.3;logK2∘=2.8.

  9. Inelastic x-ray scattering from polycrystalline materials

    International Nuclear Information System (INIS)

    Fischer, I.

    2008-09-01

    Inelastic X-ray scattering (IXS) is a tool to determine the phonon dispersion along high symmetry directions in single crystals. However, novel materials and crystals under extreme conditions are often only available in form of polycrystalline samples. Thus the investigation is limited to orientation-averaged properties. To overcome these limitations, a methodology to extract the single crystal phonon dispersion from polycrystalline materials was developed. The approach consists of recording IXS spectra over a large momentum transfer region and confront them with a Born - von Karman model calculation. A least-square refinement of the model IXS spectra then provides the single crystal dispersion scheme. In this work the method is developed on the test case Be. Further studies were performed on more and more complex systems, in order to explore the limitations. This novel application of IXS promises to be a valuable tool in cases where single crystalline materials are not available. (author)

  10. Ultrathin polycrystalline 6,13-Bis(triisopropylsilylethynyl)-pentacene films

    Energy Technology Data Exchange (ETDEWEB)

    Jung, Min-Cherl; Zhang, Dongrong; Nikiforov, Gueorgui O.; Lee, Michael V.; Qi, Yabing, E-mail: Yabing.Qi@oist.jp [Energy Materials and Surface Sciences Unit (EMSS), Okinawa Institute of Science and Technology Graduate University (OIST), 1919-1 Tancha, Onna-son, Okinawa 904-0495 (Japan); Joo Shin, Tae; Ahn, Docheon; Lee, Han-Koo; Baik, Jaeyoon; Shin, Hyun-Joon [Pohang Accelerator Laboratory, POSTECH, Pohang 790-784 (Korea, Republic of)

    2015-03-15

    Ultrathin (<6 nm) polycrystalline films of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-P) are deposited with a two-step spin-coating process. The influence of spin-coating conditions on morphology of the resulting film was examined by atomic force microscopy. Film thickness and RMS surface roughness were in the range of 4.0–6.1 and 0.6–1.1 nm, respectively, except for small holes. Polycrystalline structure was confirmed by grazing incidence x-ray diffraction measurements. Near-edge x-ray absorption fine structure measurements suggested that the plane through aromatic rings of TIPS-P molecules was perpendicular to the substrate surface.

  11. Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon

    Science.gov (United States)

    Yoon, Yohan; Yan, Yixin; Ostrom, Nels P.; Kim, Jinwoo; Rozgonyi, George

    2012-11-01

    Continuous-Czochralski (c-Cz) crystal growth has been suggested as a viable technique for the fabrication of photovoltaic Si wafers due to its low resistivity variation of any dopant, independent of segregation, compared to conventional Cz. In order to eliminate light induced degradation due to boron-oxygen traps in conventional p-type silicon wafers, gallium doped wafers have been grown by c-Cz method and investigated using four point probe, deep level transient spectroscopy (DLTS), and microwave-photoconductance decay. Iron-gallium related electrically active defects were identified using DLTS as the main lifetime killers responsible for reduced non-uniform lifetimes in radial and axial positions of the c-Cz silicon ingot. A direct correlation between minority carrier lifetime and the concentration of electrically active Fe-Ga pairs was established.

  12. Preliminary neutron design of the flux flatter for silicon doping at the RA10

    International Nuclear Information System (INIS)

    Cintas, A.; Bazzana, S.

    2012-01-01

    The neutron transmutation doping of silicon (NTD) is one of the facilities under development for the RA10 project. In order to obtain high quality semiconductor, commercial requirements of NTD include achieving high axial and radial uniformity in the silicon targets. Axial uniformity is achieved locating a neutron screen around the Si ingot, obtaining a flat axial distribution of the dopant concentration. We present the neutron design of this screen, also known as flux flattener. MCNP5 was used to model the screen design. We have reached a satisfactory preliminary screen design after numerous iterations. The fluctuation in the axial distribution of the reaction capture rate ( 30 Si(n,γ) 31 Si) is under ≠1,5%, which is the required level by the semiconductor industry to accept the final product (author)

  13. Polycrystalline diamond film UV detectors for excimer lasers

    International Nuclear Information System (INIS)

    Ralchenko, V G; Savel'ev, A V; Konov, Vitalii I; Mazzeo, G; Spaziani, F; Conte, G; Polyakov, V I

    2006-01-01

    Photoresistive metal-semiconductor-metal detectors based on polycrystalline diamond films are fabricated for recording cw and pulsed UV radiation. The detectors have a high spectral selectivity (the UV-to-VIS response ratio is ∼10 5 ) and a temporal resolution of the order of 10 9 s. 'Solar-blind' photostable diamond detectors are promising for applications in UV lithography, laser micromachining, medicine, and space research. (letters)

  14. Ferromagnetic clusters in polycrystalline BaCoO3

    International Nuclear Information System (INIS)

    Botta, P.M.; Pardo, V.; Calle, C. de la; Baldomir, D.; Alonso, J.A.; Rivas, J.

    2007-01-01

    Polycrystalline BaCoO 3 was synthesized by a citrate technique using thermal treatments at high oxygen pressure. Magnetic susceptibility measurements on the compound were carried out under AC conditions. The magnetic properties of the material at low temperatures were found to be determined by the appearance of nanoscale ferromagnetic (FM) regions and not by a true magnetic phase transition. These clusters have a mean size of about 1 nm in diameter and obey an Arrhenius-like thermal relaxation

  15. Geochemistry of silicon isotopes

    Energy Technology Data Exchange (ETDEWEB)

    Ding, Tiping; Li, Yanhe; Gao, Jianfei; Hu, Bin [Chinese Academy of Geological Science, Beijing (China). Inst. of Mineral Resources; Jiang, Shaoyong [China Univ. of Geosciences, Wuhan (China).

    2018-04-01

    Silicon is one of the most abundant elements in the Earth and silicon isotope geochemistry is important in identifying the silicon source for various geological bodies and in studying the behavior of silicon in different geological processes. This book starts with an introduction on the development of silicon isotope geochemistry. Various analytical methods are described and compared with each other in detail. The mechanisms of silicon isotope fractionation are discussed, and silicon isotope distributions in various extraterrestrial and terrestrial reservoirs are updated. Besides, the applications of silicon isotopes in several important fields are presented.

  16. The effect of polycrystalline rod insertion in a low Prandtl number melt for continuous Czochralski system

    Science.gov (United States)

    Nam, Phil-Ouk; Son, Seung-Suk; Yi, Kyung-Woo

    2010-04-01

    The increased wafer size results in greater instabilities and complexities within the silicon melt, and melt flow control through the application of magnetic fields is not adequate to stabilize the melt. Therefore, continuous Czochralski systems are being studied as a solution to these issues, with higher productivity and no change in size. The purpose of this study is to observe the effects of polycrystalline rod insertion on the melt for a continuous Czochralski system. In order to observe flow patterns within the melt both broadly and specifically, we employ experimentation on a model system in tandem with numerical simulation. The rod insertion do not significantly affect near the crystal edge. In the melt height from 0.14 to 0.09 m, an asymmetric temperature distributions arise when the crystal rotation is counterclockwise direction (-15 rpm) and the crucible rotation is clockwise direction (3 rpm). The axis-symmetrical temperature distribution is formed at lower melt heights (0.08 and 0.07 m). When the melt height is 0.07 m, the axis-symmetric temperature distribution is maintained even after the rod insertion.

  17. Selective deposition of polycrystalline diamond films using photolithography with addition of nanodiamonds as nucleation centers

    International Nuclear Information System (INIS)

    Okhotnikov, V V; Linnik, S A; Gaidaichuk, A V; Shashev, D V; Nazarova, G Yu; Yurchenko, V I

    2016-01-01

    A new method of selective deposition of polycrystalline diamond has been developed and studied. The diamond coatings with a complex, predetermined geometry and resolution up to 5 μm were obtained. A high density of polycrystallites in the coating area was reached (up to 32·10 7 pcs/cm 2 ). The uniformity of the film reached 100%, and the degree of the surface contamination by parasitic crystals did not exceed 2%. The technology was based on the application of the standard photolithography with an addition of nanodiamond suspension into the photoresist that provided the creation of the centers of further nucleation in the areas which require further overgrowth. The films were deposited onto monocrystalline silicon substrates using the method of “hot filaments” in the CVD reactor. The properties of the coating and the impact of the nanodiamond suspension concentration in the photoresist were also studied. The potential use of the given method includes a high resolution, technological efficiency, and low labor costs compared to the standard methods (laser treatment, chemical etching in aggressive environments,). (paper)

  18. Selective deposition of polycrystalline diamond films using photolithography with addition of nanodiamonds as nucleation centers

    Science.gov (United States)

    Okhotnikov, V. V.; Linnik, S. A.; Gaidaichuk, A. V.; Shashev, D. V.; Nazarova, G. Yu; Yurchenko, V. I.

    2016-02-01

    A new method of selective deposition of polycrystalline diamond has been developed and studied. The diamond coatings with a complex, predetermined geometry and resolution up to 5 μm were obtained. A high density of polycrystallites in the coating area was reached (up to 32·107 pcs/cm2). The uniformity of the film reached 100%, and the degree of the surface contamination by parasitic crystals did not exceed 2%. The technology was based on the application of the standard photolithography with an addition of nanodiamond suspension into the photoresist that provided the creation of the centers of further nucleation in the areas which require further overgrowth. The films were deposited onto monocrystalline silicon substrates using the method of “hot filaments” in the CVD reactor. The properties of the coating and the impact of the nanodiamond suspension concentration in the photoresist were also studied. The potential use of the given method includes a high resolution, technological efficiency, and low labor costs compared to the standard methods (laser treatment, chemical etching in aggressive environments,).

  19. Significant enhancement of the thermoelectric figure of merit of polycrystalline Si films by reducing grain size

    International Nuclear Information System (INIS)

    Valalaki, K; Nassiopoulou, A G; Vouroutzis, N

    2016-01-01

    The thermoelectric properties of p-type polycrystalline silicon thin films deposited by low pressure chemical vapour deposition (LPCVD) were accurately determined at room temperature and the thermoelectric figure of merit was deduced as a function of film thickness, ranging from 100 to 500 nm. The effect of film thickness on their thermoelectric performance is discussed. More than threefold increase in the thermoelectric figure of merit of the 100 nm thick polysilicon film was observed compared to the 500 nm thick film, reaching a value as high as 0.033. This enhancement is mainly the result of the smaller grain size in the thinner films. With the decrease in grain size the resistivity of the films is increased twofold and electrical conductivity decreased, however the Seebeck coefficient is increased by 30% and the thermal conductivity is decreased eightfold, being mainly at the origin of the increased figure of merit of the 100 nm film. Our experimental results were compared to known theoretical models and the possible mechanisms involved are presented and discussed. (paper)

  20. Mesoscopic approach to modeling elastic-plastic polycrystalline material behaviour

    International Nuclear Information System (INIS)

    Kovac, M.; Cizelj, L.

    2001-01-01

    Extreme loadings during severe accident conditions might cause failure or rupture of the pressure boundary of a reactor coolant system. Reliable estimation of the extreme deformations can be crucial to determine the consequences of such an accident. One of important drawbacks of classical continuum mechanics is idealization of inhomogenous microstructure of materials. This paper discusses the mesoscopic approach to modeling the elastic-plastic behavior of a polycrystalline material. The main idea is to divide the continuum (e.g., polycrystalline aggregate) into a set of sub-continua (grains). The overall properties of the polycrystalline aggregate are therefore determined by the number of grains in the aggregate and properties of randomly shaped and oriented grains. The random grain structure is modeled with Voronoi tessellation and random orientations of crystal lattices are assumed. The elastic behavior of monocrystal grains is assumed to be anisotropic. Crystal plasticity is used to describe plastic response of monocrystal grains. Finite element method is used to obtain numerical solutions of strain and stress fields. The analysis is limited to two-dimensional models.(author)

  1. Physics of grain boundaries in polycrystalline photovoltaic semiconductors

    Energy Technology Data Exchange (ETDEWEB)

    Yan, Yanfa, E-mail: yanfa.yan@utoledo.edu; Yin, Wan-Jian; Wu, Yelong; Shi, Tingting; Paudel, Naba R. [Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization, The University of Toledo, Ohio 43606 (United States); Li, Chen [Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Poplawsky, Jonathan [The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States); Wang, Zhiwei [Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization, The University of Toledo, Ohio 43606 (United States); National Renewable Energy Laboratory, Golden, Colorado 80401 (United States); Moseley, John; Guthrey, Harvey; Moutinho, Helio; Al-Jassim, Mowafak M. [National Renewable Energy Laboratory, Golden, Colorado 80401 (United States); Pennycook, Stephen J. [Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996 (United States)

    2015-03-21

    Thin-film solar cells based on polycrystalline Cu(In,Ga)Se{sub 2} (CIGS) and CdTe photovoltaic semiconductors have reached remarkable laboratory efficiencies. It is surprising that these thin-film polycrystalline solar cells can reach such high efficiencies despite containing a high density of grain boundaries (GBs), which would seem likely to be nonradiative recombination centers for photo-generated carriers. In this paper, we review our atomistic theoretical understanding of the physics of grain boundaries in CIGS and CdTe absorbers. We show that intrinsic GBs with dislocation cores exhibit deep gap states in both CIGS and CdTe. However, in each solar cell device, the GBs can be chemically modified to improve their photovoltaic properties. In CIGS cells, GBs are found to be Cu-rich and contain O impurities. Density-functional theory calculations reveal that such chemical changes within GBs can remove most of the unwanted gap states. In CdTe cells, GBs are found to contain a high concentration of Cl atoms. Cl atoms donate electrons, creating n-type GBs between p-type CdTe grains, forming local p-n-p junctions along GBs. This leads to enhanced current collections. Therefore, chemical modification of GBs allows for high efficiency polycrystalline CIGS and CdTe thin-film solar cells.

  2. Polycrystalline diamond detectors with three-dimensional electrodes

    Energy Technology Data Exchange (ETDEWEB)

    Lagomarsino, S., E-mail: lagomarsino@fi.infn.it [University of Florence, Department of Physics, Via Sansone 1, 50019 Sesto Fiorentino (Italy); INFN Firenze, Via B. Rossi 1, 50019 Sesto Fiorentino (Italy); Bellini, M. [INO-CNR Firenze, Largo E. Fermi 6, 50125 Firenze (Italy); Brianzi, M. [INFN Firenze, Via B. Rossi 1, 50019 Sesto Fiorentino (Italy); Carzino, R. [Smart Materials-Nanophysics, Istituto Italiano di Tecnologia, Genova, Via Morego 30, 16163 Genova (Italy); Cindro, V. [Joseph Stefan Institute, Jamova Cesta 39, 1000 Ljubljana (Slovenia); Corsi, C. [University of Florence, Department of Physics, Via Sansone 1, 50019 Sesto Fiorentino (Italy); LENS Firenze, Via N. Carrara 1, 50019 Sesto Fiorentino (Italy); Morozzi, A.; Passeri, D. [INFN Perugia, Perugia (Italy); Università degli Studi di Perugia, Dipartimento di Ingegneria, via G. Duranti 93, 06125 Perugia (Italy); Sciortino, S. [University of Florence, Department of Physics, Via Sansone 1, 50019 Sesto Fiorentino (Italy); INFN Firenze, Via B. Rossi 1, 50019 Sesto Fiorentino (Italy); Servoli, L. [INFN Perugia, Perugia (Italy)

    2015-10-01

    The three-dimensional concept in diamond detectors has been applied, so far, to high quality single-crystal material, in order to test this technology in the best available conditions. However, its application to polycrystalline chemical vapor deposited diamond could be desirable for two reasons: first, the short inter-electrode distance of three-dimensional detectors should improve the intrinsically lower collection efficiency of polycrystalline diamond, and second, at high levels of radiation damage the performances of the poly-crystal material are not expected to be much lower than those of the single crystal one. We report on the fabrication and test of three-dimensional polycrystalline diamond detectors with several inter-electrode distances, and we demonstrate that their collection efficiency is equal or higher than that obtained with conventional planar detectors fabricated with the same material. - Highlights: • Pulsed laser fabrication of polycristalline diamond detectors with 3D electrodes. • Measurement of the charge collection efficiency (CCE) under beta irradiation. • Comparation between the CCE of 3D and conventional planar diamond sensors. • A rationale for the behavior of three-dimensional and planar sensors is given.

  3. Proposal of a neutron transmutation doping facility for n-type spherical silicon solar cell at high-temperature engineering test reactor.

    Science.gov (United States)

    Ho, Hai Quan; Honda, Yuki; Motoyama, Mizuki; Hamamoto, Shimpei; Ishii, Toshiaki; Ishitsuka, Etsuo

    2018-05-01

    The p-type spherical silicon solar cell is a candidate for future solar energy with low fabrication cost, however, its conversion efficiency is only about 10%. The conversion efficiency of a silicon solar cell can be increased by using n-type silicon semiconductor as a substrate. This study proposed a new method of neutron transmutation doping silicon (NTD-Si) for producing the n-type spherical solar cell, in which the Si-particles are irradiated directly instead of the cylinder Si-ingot as in the conventional NTD-Si. By using a 'screw', an identical resistivity could be achieved for the Si-particles without a complicated procedure as in the NTD with Si-ingot. Also, the reactivity and neutron flux swing could be kept to a minimum because of the continuous irradiation of the Si-particles. A high temperature engineering test reactor (HTTR), which is located in Japan, was used as a reference reactor in this study. Neutronic calculations showed that the HTTR has a capability to produce about 40t/EFPY of 10Ωcm resistivity Si-particles for fabrication of the n-type spherical solar cell. Copyright © 2018 Elsevier Ltd. All rights reserved.

  4. Synthesis of silicon nanocrystals in silane plasmas for nanoelectronics and large area electronic devices

    International Nuclear Information System (INIS)

    Roca i Cabarrocas, P; Nguyen-Tran, Th; Djeridane, Y; Abramov, A; Johnson, E; Patriarche, G

    2007-01-01

    The synthesis of silicon nanocrystals in standard radio-frequency glow discharge systems is studied with respect to two main objectives: (i) the production of devices based on quantum size effects associated with the small dimensions of silicon nanocrystals and (ii) the synthesis of polymorphous and polycrystalline silicon films in which silicon nanocrystals are the elementary building blocks. In particular we discuss results on the mechanisms of nanocrystal formation and their transport towards the substrate. We found that silicon nanocrystals can contribute to a significant fraction of deposition (50-70%) and that they can be positively charged. This has a strong influence on their deposition because positively charged nanocrystals will be accelerated towards the substrate with energy of the order of the plasma potential. However, the important parameter with respect to the deposition of charged nanocrystals is not the accelerating voltage but the energy per atom and thus a doubling of the diameter will result in a decrease in the energy per atom by a factor of 8. To leverage this geometrical advantage we propose the use of more electronegative gases, which may have a strong effect on the size and charge distribution of the nanocrystals. This is illustrated in the case of deposition from silicon tetrafluoride plasmas in which we observe low-frequency plasma fluctuations, associated with successive generations of nanocrystals. The contribution of larger nanocrystals to deposition results in a lower energy per deposited atom and thus polycrystalline films

  5. Microstructure and mechanical properties of Al–1Mn and Al–10Si alloy circular clad ingot prepared by direct chill casting

    International Nuclear Information System (INIS)

    Fu, Ying; Jie, Jinchuan; Wu, Li; Park, Joonpyo; Sun, Jianbo; Kim, Jongho; Li, Tingju

    2013-01-01

    An innovative direct chill casting process to prepare Al–10 wt%Si and Al–1 wt%Mn alloy circular clad ingots has been developed in the present study. The experimental casting parameters were determined by theoretical analysis, numerical simulation and experimental processes. The interface of clad ingots was investigated by methods of metallographic examination, electron probe microanalysis (EPMA) and transmission electron microscopy (TEM). The results showed that excellent metallurgical bonding of two different aluminum alloys could be achieved by direct chill casting. The Al–1Mn alloy which was poured into the mold earlier served as the substrate for heterogeneous nucleation of Al–10Si alloy. Because of diffusion of Si and Mn elements, a diffusion layer with a thickness of about 40 μm on average between the Al–10Si and Al–1Mn alloys could be obtained. The tensile strength of the clad ingot was 106.8 MPa and the fractured position was located in the Al–1Mn alloy side, indicating the strength of the interfacial region is higher than that of Al–1Mn alloy.

  6. The influence of ingot annealing on the corrosion resistance of a PrFeCoBNbP alloy

    International Nuclear Information System (INIS)

    Oliveira, M.C.L.; Takiishi, H.; Faria, R.N.; Costa, I.

    2008-01-01

    The influence of the annealing time on the corrosion resistance of a Pr-Fe-Co-B-Nb alloy with the addition of 0.1 wt% P was investigated here using potentiodynamic polarization and electrochemical impedance spectroscopy (EIS). The cast ingot alloys were annealed at 1100 deg. C for 10, 15 and 20 h. The specimens were immersed for 30 days in naturally aerated 0.02 M Na 2 HPO 4 solution at room temperature, during which period the evolution of the electrochemical behavior was assessed using EIS. The results indicated that the corrosion resistance of the Pr 14 Fe bal Co 16 B 6 Nb 0.1 P 0.25 alloy was related to the annealing time and, hence, to its microstructure. Annealing at 1100 deg. C for 10 h was insufficient to eliminate the Fe-α phase from the alloy microstructure, whereas annealing for 15 and 20 h removed an increasing amount of Fe-α phase, thereby increasing the alloy's corrosion resistance

  7. Development and characterization of Al-Zn alloy by ingot metallurgy and powder metallurgy with improved mechanical properties

    International Nuclear Information System (INIS)

    Waseem, M.; Awais, H.B.; Zauha, M.S.; Tariq, N.H.

    2007-01-01

    Current project focuses on the production of AI-Zn alloy AA7075 used for wide range of applications like Aircraft components, missile and other structural applications. The above alloy was developed by two different routes. One was melting /casting, after which alloy was characterized by microstructural - examination (optical and SEM) and mechanical testing. Other route was the preparation of this alloy by powder metallurgy. This involves preparation of powders, mechanical alloying, compaction, sintering, rolling, solution treatment and aging then analysis. Powders of Aluminum, Zinc and powders of master alloys of AI-Cu, AI-Mg, AI-Mn, and AI-Cr were Mechanical alloyed. Then this powder was compacted by uniaxial press to form pellets. Sintering was carried out at 500 degree C and then hot rolled in Ar atmosphere. After solution and aging treatments samples were characterized. It is observed that there is about 12-21% improvement in mechanical properties such as tensile strength, yield strength, ductility and fracture toughness due to the more fine microstructure and less segregation than ingot metallurgy route. (author)

  8. Hot Deformation Behavior and a Two-Stage Constitutive Model of 20Mn5 Solid Steel Ingot during Hot Compression

    Directory of Open Access Journals (Sweden)

    Min Liu

    2018-03-01

    Full Text Available 20Mn5 steel is widely used in the manufacture of heavy hydro-generator shaft forging due to its strength, toughness, and wear resistance. However, the hot deformation and recrystallization behaviors of 20Mn5 steel compressed under a high temperature were not studied. For this article, hot compression experiments under temperatures of 850–1200 °C and strain rates of 0.01 s−1–1 s−1 were conducted using a Gleeble-1500D thermo-mechanical simulator. Flow stress-strain curves and microstructure after hot compression were obtained. Effects of temperature and strain rate on microstructure are analyzed. Based on the classical stress-dislocation relationship and the kinetics of dynamic recrystallization, a two-stage constitutive model is developed to predict the flow stress of 20Mn5 steel. Comparisons between experimental flow stress and predicted flow stress show that the predicted flow stress values are in good agreement with the experimental flow stress values, which indicates that the proposed constitutive model is reliable and can be used for numerical simulation of hot forging of 20Mn5 solid steel ingot.

  9. Microstructure Evolution and Flow Stress Model of a 20Mn5 Hollow Steel Ingot during Hot Compression.

    Science.gov (United States)

    Liu, Min; Ma, Qing-Xian; Luo, Jian-Bin

    2018-03-21

    20Mn5 steel is widely used in the manufacture of heavy hydro-generator shaft due to its good performance of strength, toughness and wear resistance. However, the hot deformation and recrystallization behaviors of 20Mn5 steel compressed under high temperature were not studied. In this study, the hot compression experiments under temperatures of 850-1200 °C and strain rates of 0.01/s-1/s are conducted using Gleeble thermal and mechanical simulation machine. And the flow stress curves and microstructure after hot compression are obtained. Effects of temperature and strain rate on microstructure are analyzed. Based on the classical stress-dislocation relation and the kinetics of dynamic recrystallization, a two-stage constitutive model is developed to predict the flow stress of 20Mn5 steel. Comparisons between experimental flow stress and predicted flow stress show that the predicted flow stress values are in good agreement with the experimental flow stress values, which indicates that the proposed constitutive model is reliable and can be used for numerical simulation of hot forging of 20Mn5 hollow steel ingot.

  10. Detection of carbon dioxide in the gases evolved during the hot extraction determination of hydrogen in uranium ingots

    International Nuclear Information System (INIS)

    Jursik, M.L.; Pope, J.D.

    1977-08-01

    The hot extraction method was used at the National Lead Company of Ohio to determine hydrogen in uranium metal at the 2 ppM level. The volume of gas evolved from the heated sample was assumed to be hydrogen. When a liquid nitrogen trap was placed into the system the hydrogen values were reduced 5 to 10%. The gas retained by the nitrogen trap was identified by mass spectrometry as predominantly carbon dioxide. Low hydrogen values were observed only when the nitrogen trap was used in the analysis of high-carbon (300 to 600 ppM) uranium from NLO production ingots. However, hydrogen values for low-carbon (30 to 50 ppM) uranium were unaffected by the nitrogen trap. The formation of carbon dioxide appears to be associated with the carbon content of the uranium metal. Comparisons of hydrogen values obtained with the hot extraction method and with an inert fusion--thermal conductivity method are also presented. 3 tables, 4 figures

  11. Bonding silicon nitride using glass-ceramic

    International Nuclear Information System (INIS)

    Dobedoe, R.S.

    1995-01-01

    Silicon nitride has been successfully bonded to itself using magnesium-aluminosilicate glass and glass-ceramic. For some samples, bonding was achieved using a diffusion bonder, but in other instances, following an initial degassing hold, higher temperatures were used in a nitrogen atmosphere with no applied load. For diffusion bonding, a small applied pressure at a temperature below which crystallisation occurs resulted in intimate contact. At slightly higher temperatures, the extent of the reaction at the interface and the microstructure of the glass-ceramic joint was highly sensitive to the bonding temperature. Bonding in a nitrogen atmosphere resulted in a solution-reprecipitation reaction. A thin layer of glass produced a ''dry'', glass-free joint, whilst a thicker layer resulted in a continuous glassy join across the interface. The chromium silicide impurities within the silicon nitride react with the nucleating agent in the glass ceramic, which may lead to difficulty in producing a fine glass-ceramic microstructure. Slightly lower temperatures in nitrogen resulted in a polycrystalline join but the interfacial contact was poor. It is hoped that one of the bonds produced may be developed to eventually form part of a graded joint between silicon nitride and a high temperature nickel alloy. (orig.)

  12. Formation of hypereutectic silicon particles in hypoeutectic Al-Si alloys under the influence of high-intensity ultrasonic vibration

    Directory of Open Access Journals (Sweden)

    Xiaogang Jian

    2013-03-01

    Full Text Available The modification of eutectic silicon is of general interest since fine eutectic silicon along with fine primary aluminum grains improves mechanical properties and ductilities. In this study, high intensity ultrasonic vibration was used to modify the complex microstructure of aluminum hypoeutectic alloys. The ultrasonic vibrator was placed at the bottom of a copper mold with molten aluminum. Hypoeutectic Al-Si alloy specimens with a unique in-depth profile of microstructure distribution were obtained. Polyhedral silicon particles, which should form in a hypereutectic alloy, were obtained in a hypoeutectic Al-Si alloy near the ultrasonic radiator where the silicon concentration was higher than the eutectic composition. The formation of hypereutectic silicon near the radiator surface indicates that high-intensity ultrasonic vibration can be used to influence the phase transformation process of metals and alloys. The size and morphology of both the silicon phase and the aluminum phase varies with increasing distance from the ultrasonic probe/radiator. Silicon morphology develops into three zones. Polyhedral primary silicon particles present in zone I, within 15 mm from the ultrasonic probe/radiator. Transition from hypereutectic silicon to eutectic silicon occurs in zone II about 15 to 20 祄 from the ultrasonic probe/radiator. The bulk of the ingot is in zone III and is hypoeutectic Al-Si alloy containing fine lamellar and fibrous eutectic silicon. The grain size is about 15 to 25 祄 in zone I, 25 to 35 祄 in zone II, and 25 to 55 祄 in zone III. The morphology of the primary ?Al phase is also changed from dendritic (in untreated samples to globular. Phase evolution during the solidification process of the alloy subjected to ultrasonic vibration is described.

  13. Effects of silicon cross section and neutron spectrum on the radial uniformity in neutron transmutation doping

    International Nuclear Information System (INIS)

    Kim, Haksung; Ho Pyeon, Cheol; Lim, Jae-Yong; Misawa, Tsuyoshi

    2012-01-01

    The effects of silicon cross section and neutron spectrum on the radial uniformity of a Si-ingot are examined experimentally with various neutron spectrum conditions. For the cross section effect, the numerical results using silicon single crystal cross section reveal good agreements with experiments within relative difference of 6%, whereas the discrepancy is approximately 20% in free-gas cross section. For the neutron spectrum effect, the radial uniformity in hard neutron spectrum is found to be more flattening than that in soft spectrum. - Highlights: ► The effects of silicon cross section and neutron spectrum on the radial uniformity in NTD were experimentally investigated. ► The numerical results using silicon single crystal cross section reveal good agreements. ► The radial uniformity in hard neutron spectrum was more flat than that in soft spectrum. ► The silicon single crystal cross section and hard neutron spectrum are recommended for numerical analyses and radial uniformity flattening in NTD, respectively.

  14. Development of advanced Czochralski growth process to produce low cost 150 kg silicon ingots from a single crucible for technology readiness

    Science.gov (United States)

    1981-06-01

    The process development continued, with a total of nine crystal growth runs. One of these was a 150 kg run of 5 crystals of approximately 30 kg each. Several machine and process problems were corrected and the 150 kg run was as successful as previous long runs on CG2000 RC's. The accelerated recharge and growth will be attempted when the development program resumes at full capacity in FY '82. The automation controls (Automatic Grower Light Computer System) were integrated to the seed dip temperature, shoulder, and diameter sensors on the CG2000 RC development grower. Test growths included four crystals, which were grown by the computer/sensor system from seed dip through tail off. This system will be integrated on the Mod CG2000 grower during the next quarter. The analytical task included the completion and preliminary testing of the gas chromatograph portion of the Furnace Atmosphere Analysis System. The system can detect CO concentrations and will be expanded to oxygen and water analysis in FY '82.

  15. Development of advanced Czochralski growth process to produce low cost 150 kg silicon ingots from a single crucible for technology readiness. [crystal growth

    Science.gov (United States)

    Lane, R. L.

    1981-01-01

    Six growth runs used the Kayex-Hameo Automatic Games Logic (AGILE) computer based system for growth from larger melts in the Mod CG2000. The implementation of the melt pyrometer sensor allowed for dip temperature monitoring and usage by the operator/AGILE system. Use of AGILE during recharge operations was successfully evaluated. The tendency of crystals to lose cylindrical shape (spiraling) continued to be a problem. The hygrometer was added to the Furnace Gas Analysis System and used on several growth runs. The gas chromatograph, including the integrator, was also used for more accurate carbon monoxide concentration measurements. Efforts continued for completing the automation of the total Gas Analysis System. An economic analysis, based on revised achievable straight growth rate, is presented.

  16. Palladium assisted silver transport in polycrystalline SiC

    Energy Technology Data Exchange (ETDEWEB)

    Neethling, J.H., E-mail: Jan.Neethling@nmmu.ac.za [Physics Department, Nelson Mandela Metropolitan University, PO Box 77000, Port Elizabeth 6031 (South Africa); O' Connell, J.H.; Olivier, E.J. [Physics Department, Nelson Mandela Metropolitan University, PO Box 77000, Port Elizabeth 6031 (South Africa)

    2012-10-15

    The transport of silver in polycrystalline 3C-SiC and hexagonal 6H-SiC has been investigated by annealing the SiC samples in contact with a Pd-Ag compound at temperatures of 800 and 1000 Degree-Sign C and times of 24 and 67 h. The Pd was added in an attempt to improve the low wetting of SiC by Ag and further because Pd is produced in measurable concentrations in coated particles during reactor operation. Pd is also known to coalesce at the IPyC-SiC interface and to chemically attack the SiC layer. SEM, TEM and EDS were used to show that the Ag penetrates polycrystalline SiC along grain boundaries together with Pd. It is suggested that Ag transport in SiC takes place along grain boundaries in the form of moving nodules consisting of a Ag-Pd mixture. It is assumed that the nodules move along grain boundaries by dissolving the SiC at the leading edge followed by the reprecipitation of SiC at the trailing edge. Since the solubility of Cs in Ag and Pd is extremely low, it is unlikely that Cs will penetrate the SiC together with the Ag-Pd compound if present at the IPyC-SiC interface. If it is assumed that the dominant transport mechanism of Ag in intact polycrystalline SiC is indeed the Pd assisted mechanism, then the stabilization of Pd (and other metallic fission products) in the kernel could be a way of mitigating Ag release from TRISO-coated particles.

  17. Palladium assisted silver transport in polycrystalline SiC

    International Nuclear Information System (INIS)

    Neethling, J.H.; O’Connell, J.H.; Olivier, E.J.

    2012-01-01

    The transport of silver in polycrystalline 3C-SiC and hexagonal 6H-SiC has been investigated by annealing the SiC samples in contact with a Pd–Ag compound at temperatures of 800 and 1000 °C and times of 24 and 67 h. The Pd was added in an attempt to improve the low wetting of SiC by Ag and further because Pd is produced in measurable concentrations in coated particles during reactor operation. Pd is also known to coalesce at the IPyC–SiC interface and to chemically attack the SiC layer. SEM, TEM and EDS were used to show that the Ag penetrates polycrystalline SiC along grain boundaries together with Pd. It is suggested that Ag transport in SiC takes place along grain boundaries in the form of moving nodules consisting of a Ag–Pd mixture. It is assumed that the nodules move along grain boundaries by dissolving the SiC at the leading edge followed by the reprecipitation of SiC at the trailing edge. Since the solubility of Cs in Ag and Pd is extremely low, it is unlikely that Cs will penetrate the SiC together with the Ag–Pd compound if present at the IPyC–SiC interface. If it is assumed that the dominant transport mechanism of Ag in intact polycrystalline SiC is indeed the Pd assisted mechanism, then the stabilization of Pd (and other metallic fission products) in the kernel could be a way of mitigating Ag release from TRISO-coated particles.

  18. Influence of copper foil polycrystalline structure on graphene anisotropic etching

    Energy Technology Data Exchange (ETDEWEB)

    Sharma, Kamal P. [Department of Frontier Materials, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan); Mahyavanshi, Rakesh D. [Department of Physical Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan); Kalita, Golap, E-mail: kalita.golap@nitech.ac.jp [Department of Frontier Materials, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan); Department of Physical Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan); Tanemura, Masaki [Department of Frontier Materials, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan); Department of Physical Science and Engineering, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555 (Japan)

    2017-01-30

    Graphical abstract: Hexagonal hole formation with anisotropic etching independent of the stripes and wrinkles in the synthesized graphene. We also observed variation in etched pattern of the graphene depending on the base Cu grain orientations, attributing to difference in nucleation and growth process. - Highlights: • Reveal the influence of copper polycrystalline structure on anisotropic etching of graphene. • Hexagonal hole formation with etching is observed to be independent of stripes and wrinkles in graphene. • Variation in etched pattern of graphene depending on the base Cu grain is confirmed. • This finding will help to understand the nature of microscopic etched pattern in graphene. - Abstract: Anisotropic etching of graphene and other two dimensional materials is an important tool to understand the growth process as well as enabling fabrication of various well-defined structures. Here, we reveal the influence of copper foil polycrystalline structure on anisotropic etching process of as-synthesized graphene. Graphene crystals were synthesized on the polycrystalline Cu foil by a low-pressure chemical vapor deposition (LPCVD) system. Microscopic analysis shows difference in shape, size and stripes alignment of graphene crystals with dissimilar nucleation within closure vicinity of neighboring Cu grains. Post-growth etching of such graphene crystals also significantly affected by the crystallographic nature of Cu grains as observed by the field emission scanning electron microscope (FE-SEM) and electron back scattered diffraction (EBSD) analysis. Hexagonal hole formation with anisotropic etching is observed to be independent of the stripes and wrinkles in the synthesized graphene. We also observed variation in etched pattern of the graphene depending on the base Cu grain orientations, attributing to difference in nucleation and growth process. The findings can facilitate to understand the nature of microscopic etched pattern depending on metal

  19. Influence of copper foil polycrystalline structure on graphene anisotropic etching

    International Nuclear Information System (INIS)

    Sharma, Kamal P.; Mahyavanshi, Rakesh D.; Kalita, Golap; Tanemura, Masaki

    2017-01-01

    Graphical abstract: Hexagonal hole formation with anisotropic etching independent of the stripes and wrinkles in the synthesized graphene. We also observed variation in etched pattern of the graphene depending on the base Cu grain orientations, attributing to difference in nucleation and growth process. - Highlights: • Reveal the influence of copper polycrystalline structure on anisotropic etching of graphene. • Hexagonal hole formation with etching is observed to be independent of stripes and wrinkles in graphene. • Variation in etched pattern of graphene depending on the base Cu grain is confirmed. • This finding will help to understand the nature of microscopic etched pattern in graphene. - Abstract: Anisotropic etching of graphene and other two dimensional materials is an important tool to understand the growth process as well as enabling fabrication of various well-defined structures. Here, we reveal the influence of copper foil polycrystalline structure on anisotropic etching process of as-synthesized graphene. Graphene crystals were synthesized on the polycrystalline Cu foil by a low-pressure chemical vapor deposition (LPCVD) system. Microscopic analysis shows difference in shape, size and stripes alignment of graphene crystals with dissimilar nucleation within closure vicinity of neighboring Cu grains. Post-growth etching of such graphene crystals also significantly affected by the crystallographic nature of Cu grains as observed by the field emission scanning electron microscope (FE-SEM) and electron back scattered diffraction (EBSD) analysis. Hexagonal hole formation with anisotropic etching is observed to be independent of the stripes and wrinkles in the synthesized graphene. We also observed variation in etched pattern of the graphene depending on the base Cu grain orientations, attributing to difference in nucleation and growth process. The findings can facilitate to understand the nature of microscopic etched pattern depending on metal

  20. Hydrogen retention properties of polycrystalline tungsten and helium irradiated tungsten

    International Nuclear Information System (INIS)

    Hino, T.; Koyama, K.; Yamauchi, Y.; Hirohata, Y.

    1998-01-01

    The hydrogen retention properties of a polycrystalline tungsten and tungsten irradiated by helium ions with an energy of 5 keV were examined by using an ECR ion irradiation apparatus and a technique of thermal desorption spectroscopy, TDS. The polycrystalline tungsten was irradiated at RT with energetic hydrogen ions, with a flux of 10 15 H cm -2 and an energy of 1.7 keV up to a fluence of 5 x 10 18 H cm -2 . Subsequently, the amount of retained hydrogen was measured by TDS. The heating temperature was increased from RT to 1000 C, and the heating rate was 50 C min -1 . Below 1000 C, two distinct hydrogen desorption peaks were observed at 200 C and 400 C. The retained amount of hydrogen was observed to be five times smaller than that of graphite, but the concentration in the implantation layer was comparable with that of graphite. Also, the polycrystalline tungsten was irradiated with 5 keV helium ions up to a fluence of 1.4 x 10 18 He cm -2 , and then re-irradiated with 1.7 keV hydrogen ions. The amount of retained hydrogen in this later experiment was close to the value in the case without prior helium ion irradiation. However, the amount of hydrogen which desorbed around the low temperature peak, 200 C, was largely enhanced. The desorption amount at 200 C saturated for the helium fluence of more than 5 x 10 17 He cm -2 . The present data shows that the trapping state of hydrogen is largely changed by the helium ion irradiation. Additionally, 5 keV helium ion irradiation was conducted on a sample pre-implanted with hydrogen ions to simulate a helium ion impact desorption of hydrogen retained in tungsten. The amount of the hydrogen was reduced as much as 50%. (orig.)

  1. Trace diffusion of different nuclear reactions products in polycrystalline tantalum

    International Nuclear Information System (INIS)

    Beyer, G.J.; Fromm, W.D.; Novgorodov, A.F.

    1976-07-01

    Measurements of the lattice diffusion coefficients for carrier free isotopes of Hf, Lu, Yb, Tm, Tb, Gd, Eu, Ba, Cs, Y, Sr, Rb and As in polycrystalline tantalum were made over the temperature range 1700 Fsub(As)>Fsub(lanthanides)>Fsub(Sr)>Fsub(Ba)>Fsub(Hf)>Fsub(Rb)>Fsub(Cs). The data indicate, that the Arrhenius relation was obeyed over the entire temperature range. Within the lanthanide-group no differences in the diffusion velocities could be detected, this fact points to a diffusion mechanism of Me 3+ -ions of lanthanides, Me 2+ -ions of earth alkaline elements and Me + -ions of alkaline elements. (author)

  2. Progress and issues in polycrystalline thin-film PV technologies

    Energy Technology Data Exchange (ETDEWEB)

    Zweibel, K.; Ullal, H.S.; Roedern, B. von [National Renewable Energy Lab., Golden, CO (United States)

    1996-05-01

    Substantial progress has occurred in polycrystalline thin-film photovoltaic technologies in the past 18 months. However, the transition to first-time manufacturing is still under way, and technical problems continue. This paper focuses on the promise and the problems of the copper indium diselenide and cadmium telluride technologies, with an emphasis on continued R&D needs for the near-term transition to manufacturing and for next-generation improvements. In addition, it highlights the joint R&D efforts being performed in the U.S. Department of Energy/National Renewable Energy Laboratory Thin-Film Photovoltaic Partnership Program.

  3. Compensation for thermally induced birefringence in polycrystalline ceramic active elements

    International Nuclear Information System (INIS)

    Kagan, M A; Khazanov, E A

    2003-01-01

    Polycrystalline ceramics differ significantly from single crystals in that the crystallographic axes (and hence of the axes of thermally induced birefringence) are oriented randomly in each granule of the ceramic. The quaternion formalism is employed to calculate the depolarisation in the ceramics and the efficiency of its compensation. The obtained analytic expressions are in good agreement with the numerical relations. It is shown that the larger the ratio of the sample length to the granule size, the closer the properties of the ceramics to those of a single crystal with the [111] orientation (in particular, the uncompensated depolarisation is inversely proportional to this ratio). (active media)

  4. Modeling chemisorption kinetics of carbon monoxide on polycrystalline platinum

    Energy Technology Data Exchange (ETDEWEB)

    Donnelly, R.G.; Modell, M.; Baddour, R.F.

    1978-04-01

    Seven distinct desorption surface states of carbon monoxide on polycrystalline platinum were detected by deconvoluting temperature-programed desorption spectra of 4-100% carbon monoxide monolayer coverage. The adstates had fixed activation energies of desorption (22.5-32.6 kcal/mole) over the entire coverage range. Rates of formation and populations were derived. The chemisorption was modeled by a Hinshelwood-type expression which allowed for site creation and suggested that adsorbed molecules are sufficiently mobile during desorption heating to fill ordered states of minimum energy and that chemisorption into these states is noncompetitive and determined by the surface. Spectra, diagrams, graphs, tables, and 49 references.

  5. Laser beam machining of polycrystalline diamond for cutting tool manufacturing

    Science.gov (United States)

    Wyszyński, Dominik; Ostrowski, Robert; Zwolak, Marek; Bryk, Witold

    2017-10-01

    The paper concerns application of DPSS Nd: YAG 532nm pulse laser source for machining of polycrystalline WC based diamond inserts (PCD). The goal of the research was to determine optimal laser cutting parameters for cutting tool shaping. Basic criteria to reach the goal was cutting edge quality (minimalization of finishing operations), material removal rate (time and cost efficiency), choice of laser beam characteristics (polarization, power, focused beam diameter). The research was planned and realised and analysed according to design of experiment rules (DOE). The analysis of the cutting edge was prepared with use of Alicona Infinite Focus measurement system.

  6. Rotary Ultrasonic Machining of Poly-Crystalline Cubic Boron Nitride

    Directory of Open Access Journals (Sweden)

    Kuruc Marcel

    2014-12-01

    Full Text Available Poly-crystalline cubic boron nitride (PCBN is one of the hardest material. Generally, so hard materials could not be machined by conventional machining methods. Therefore, for this purpose, advanced machining methods have been designed. Rotary ultrasonic machining (RUM is included among them. RUM is based on abrasive removing mechanism of ultrasonic vibrating diamond particles, which are bonded on active part of rotating tool. It is suitable especially for machining hard and brittle materials (such as glass and ceramics. This contribution investigates this advanced machining method during machining of PCBN.

  7. New deformation model of grain boundary strengthening in polycrystalline metals

    International Nuclear Information System (INIS)

    Trefilov, V.I.; Moiseev, V.F.; Pechkovskij, Eh.P.

    1988-01-01

    A new model explaining grain boundary strengthening in polycrystalline metals and alloys by strain hardening due to localization of plastic deformation in narrow bands near grain boundaries is suggested. Occurrence of localized deformation is caused by different flow stresses in grains of different orientation. A new model takes into account the active role of stress concentrator, independence of the strengthening coefficient on deformation, influence of segregations. Successful use of the model suggested for explanation of rhenium effect in molybdenum and tungsten is alloys pointed out

  8. An acoustic emission study of plastic deformation in polycrystalline aluminium

    Science.gov (United States)

    Bill, R. C.; Frederick, J. R.; Felbeck, D. K.

    1979-01-01

    Acoustic emission experiments were performed on polycrystalline and single crystal 99.99% aluminum while undergoing tensile deformation. It was found that acoustic emission counts as a function of grain size showed a maximum value at a particular grain size. Furthermore, the slip area associated with this particular grain size corresponded to the threshold level of detectability of single dislocation slip events. The rate of decline in acoustic emission activity as grain size is increased beyond the peak value suggests that grain boundary associated dislocation sources are giving rise to the bulk of the detected acoustic emissions.

  9. An electrical conductivity inspection methodology of polycrystalline diamond cutters

    Science.gov (United States)

    Bogdanov, G.; Wiggins, J.; Bertagnolli, K.; Ludwig, R.

    2012-05-01

    The polycrystalline diamond cutter (PDC) is widely used in oil and gas drilling operations. It is manufactured by sintering diamond powder onto a tungsten carbide substrate at 6 GPa and 1500 C. During sintering, molten cobalt from the substrate infiltrates the diamond table. The residual metal content correlates with cutter performance. We present an instrument that employs electrical impedance tomography capable of imaging the 3D metal content distribution in the diamond table. These images can be used to predict cutter performance as well as detect flaws.

  10. High energy argon ion irradiations of polycrystalline iron

    International Nuclear Information System (INIS)

    Dunlop, A.; Lesueur, D.; Lorenzelli, N.; Boulanger, L.

    1986-09-01

    We present here the results of our recent irradiations of polycrystalline iron targets with very energetic (1.76 GeV) Ar ions. The targets consist of piles of thin iron samples, the total thickness of each target being somewhat greater than the theoretical range (450 μm) of the ions. We can thus separate the phenomena which occur at different average energies of the ions and study during the slowing-down process: the different types of induced nuclear reactions. They allow us to determine the experimental range of the ions, the defect profiles in the targets, the structure of the displacement cascades (electron microscopy) and their stability

  11. Complex strain paths in polycrystalline copper: microstructural aspects

    Directory of Open Access Journals (Sweden)

    M.F. Vieira

    1999-07-01

    Full Text Available Microstructural aspects of polycrystalline copper sheets subjected to complex strain paths were analysed in this work. Dislocation structures developed during the strain paths (rolling and tension and the evolution of this microstructure during reloading have been studied. The active slip systems developed in each strain path were used to explain the microstructural evolution. The heterogeneous surface deformation observed on polished tensile specimens prestrained in rolling was also analysed. The structural aspects are related with the mechanical behaviour of the material, namely with the increase in yield stress in reloading, the work hardening evolution and the premature occurrence of plastic instability for some prestrain values.

  12. Characteristics of Schottky-barrier source/drain metal-oxide-polycrystalline thin-film transistors on glass substrates

    International Nuclear Information System (INIS)

    Jung, Seung-Min; Cho, Won-Ju; Jung, Jong-Wan

    2012-01-01

    Polycrystalline-silicon (poly-Si) Schottky-barrier thin-film transistors (SB-TFTs) with Pt-silicided source /drain junctions were fabricated on glass substrates, and the electrical characteristics were examined. The amorphous silicon films on glass substrates were converted into high-quality poly-Si by using excimer laser annealing (ELA) and solid phase crystallization (SPC) methods. The crystallinity of poly-Si was analyzed by using scanning electron microscopy, transmission electron microscopy, and X-ray diffraction analysis. The silicidation process was optimized by measuring the electrical characteristics of the Pt-silicided Schottky diodes. The performances of Pt-silicided SB-TFTs using poly-Si films on glass substrates and crystallized by using ELA and SPC were demonstrated. The SB-TFTs using the ELA poly-Si film demonstrated better electrical performances such as higher mobility (22.4 cm 2 /Vs) and on/off current ratio (3 x 10 6 ) and lower subthreshold swing value (120 mV/dec) than the SPC poly-Si films.

  13. Preparation of uranium ingots from double fluorides; Elaboration de lingots d'uranium a partir de fluorures doubles

    Energy Technology Data Exchange (ETDEWEB)

    Le Boulbin, E [Commissariat a l' Energie Atomique, Grenoble (France). Centre d' Etudes Nucleaires

    1967-05-15

    A simple method has been developed for the preparation of uranium double fluorides and has given a new impetus to the study of the reduction of these compounds with a view to obtaining very pure uranium ingots. This reduction can be carried out using calcium or magnesium as the reducing agent, this latter metal being very interesting from the practical point of view. A comparative study of the heat balances of the reduction processes for the double fluorides and for uranium tetrafluoride has shown that reduction of the double fluorides is possible. The exact experimental conditions for these reductions have been determined. Our study has shown in particular that the reduction of the double salt UF{sub 4}, CaF{sub 2} by magnesium leads to the production of small (20 to 500 g) samples of high-purity uranium with a yield of 99 per cent. (author) [French] La mise au point d'une methode simple de preparation de fluorures doubles d'uranium a remis a l'ordre du jour la reduction de ces composes en vue d'obtenir des lingots d'uranium tres pur. Cette reduction peut etre conduite en utilisant du calcium ou du magnesium comme reducteur, ce dernier metal etant tres interessant du point de vue pratique. Une etude comparative des bilans thermiques des reductions des fluorures doubles et du tetrafluorure d'uranium a montre que la reduction des fluorures doubles etait possible. Les conditions experimentales precises de ces reductions ont ete determinees. Notre etude a montre, en particulier, que la reduction du sel double UF{sub 4}, F{sub 2}Ca par le magnesium permet d'obtenir sur des petites quantites de 20 a 500 g, de l'uranium de haute purete avec un rendement de 99 pour cent. (auteur)

  14. Cellular dislocations patterns in monolike silicon: Influence of stress, time under stress and impurity doping

    Science.gov (United States)

    Oliveira, V. A.; Rocha, M.; Lantreibecq, A.; Tsoutsouva, M. G.; Tran-Thi, T. N.; Baruchel, J.; Camel, D.

    2018-05-01

    Besides the well-known local sub-grain boundaries (SGBs) defects, monolike Si ingots grown by Directional Solidification present distributed background cellular dislocation structures. In the present work, the influence of stress level, time under stress, and doping by O and Ge, on the formation of dislocation cells in monolike silicon, is analysed. This is achieved by performing a comparative study of the dislocation structures respectively obtained during crystallisation of pilot scale monolike ingots on Czochralski (CZ) and monolike seeds, during annealing of Float Zone (FZ), CZ, and 1 × 1020 at/cm3 Ge-doped CZ (GCZ) samples, and during 4-point bending of FZ and GCZ samples at 1300 °C under resolved stresses of 0.3, 0.7 and 1.9 MPa during 1-20 h. Synchrotron X-ray White-beam Topography and Rocking Curve Imaging (RCI) are applied to visualize the dislocation arrangements and to quantify the spatial distribution of the associated lattice distortions. Annealed samples and samples bent under 0.3 MPa present dislocation structures corresponding to transient creep stages where dislocations generated from surface defects are propagating and multiplying in the bulk. The addition of the hardening element Ge is found to block the propagation of dislocations from these surface sources during the annealing test, and to retard dislocation multiplication during bending under 0.3 MPa. On the opposite, cellular structures corresponding to the final stationary creep stage are obtained both in the non-molten seeds and grown part of monolike ingots and in samples bent under 0.7 and 1.9 MPa. A comparative discussion is made of the dynamics of formation of these final dislocation structures during deformation at high temperature and monolike growth.

  15. Fiscal 2000 achievement report. Development of energy use rationalization-oriented silicon manufacturing process (Survey and study of analysis of commercialization of solar-grade silicon material manufacturing technology); 2000 nendo shin energy sangyo gijutsu sogo kaihatsu kiko kyodo kenkyu gyomu seika hokokusho. Energy shiyo gorika silicon seizo process kaihatsu (Taiyodenchiyou silicon genryo seizo gijutsu no jitsuyoka kaiseki ni kansuru chosa kenkyu)

    Energy Technology Data Exchange (ETDEWEB)

    NONE

    2001-03-01

    The trend of technology development, problems harbored therein, trend of the market, and the like were investigated for supporting the development of technologies for the mass production and commercialization of solar-grade silicon materials. Concerning the future of production enhancement and cost reduction in the manufacture of polycrystalline silicon solar cells, studies were made from the technological viewpoint. The results are shown below. It is estimated that approximately 4,500 tons of material silicon will be necessary in 2005 and 6,500-10,700 tons in 2010. Since the melting purification method of NEDO (New Energy and Industrial Technology Development Organization) now under development step by step toward commercialization as well as the conventional source will provide the necessary amount of material silicon, it is inferred that the development of solar cells will go on without any restraint originating in the semiconductor industry. With the commercialization of the technologies so far developed and the development/commercialization of the fast-acting high-performance solar cell technology, probabilities are high that the polycrystalline silicon solar cell manufacturing cost in 2010 will be as low as to be on the 100 yen/W (93-118 yen/W) level which is the level now held up as the goal. (NEDO)

  16. Composition of silicon fibrous nanostructures synthesized using ultrafast laser pulses under ambient conditions

    Directory of Open Access Journals (Sweden)

    Sivakumar M.

    2015-01-01

    Full Text Available In this study the composition of nanostructures generated owing to ablation of crystalline silicon using high repletion rate femtosecond laser under ambient condition is investigated. The web-like silicon fibrous nanostructures are formed in and around the laser irradiated area. Electron Microscopy investigation revealed that the nanostructures are made of nanoparticles of size about 40 nm. In addition Micro-Raman analysis shows that the nanofibrous structures comprises a mixture of amorphous and polycrystalline silicon. X-ray photoelectron spectroscopy analysis reveals the oxidized and un-oxidized elemental states of silicon in the nanostructures. Moreover web-like fibrous nanostructures are generated due to condensation of super saturated vapour and subsequent nucleus growth in the laser induced plasma plume.

  17. Development of processes for the production of low cost silicon dendritic web for solar cells

    Science.gov (United States)

    Duncan, C. S.; Seidensticker, R. G.; Mchugh, J. P.; Hopkins, R. H.; Skutch, M. E.; Driggers, J. M.; Hill, F. E.

    1980-01-01

    High area output rates and continuous, automated growth are two key technical requirements for the growth of low-cost silicon ribbons for solar cells. By means of computer-aided furnace design, silicon dendritic web output rates as high as 27 sq cm/min have been achieved, a value in excess of that projected to meet a $0.50 per peak watt solar array manufacturing cost. The feasibility of simultaneous web growth while the melt is replenished with pelletized silicon has also been demonstrated. This step is an important precursor to the development of an automated growth system. Solar cells made on the replenished material were just as efficient as devices fabricated on typical webs grown without replenishment. Moreover, web cells made on a less-refined, pelletized polycrystalline silicon synthesized by the Battelle process yielded efficiencies up to 13% (AM1).

  18. Fracture properties of polycrystalline YBa2Cu3Ox

    International Nuclear Information System (INIS)

    Cook, R.F.; Shaw, T.M.; Duncombe, P.R.

    1987-01-01

    Polycrystalline YBa 2 Cu 3 O x has been prepared by sintering pre-reacted powder in oxygen to yield a material with 15 μm grain size, 86% relative density and which superconducts above liquid nitrogen temperatures. Indentation crack length measurements give a toughness K c = 1.3 ± 0.2 MPa m 1/2 , above a threshold contact load for radial crack initiation of approximately 5 N (compared with 1.1 MPa m 1/2 and < 0.1 N, respectively, for single crystals). The increased toughness and threshold contact load are controlled by the deviation of cracks from the plane of maximum driving force for fracture by weak grain boundaries and preferred fracture planes within grains. Optical microscopy of indentation cracks and scanning electron microscopy of fracture surfaces reveals approximately 50% intergranular fracture. The hardness of the polycrystal was H = 2.0 ± 0.5 GPa (compared with 8.7 GPa for single crystals). The decreased hardness arises from the porosity of the polycrystalline material and grain boundary sliding under the indentation contact. Time dependent growth of lateral cracks at the indentation contacts suggests that these materials are susceptible to moisture controlled non-equilibrium crack growth

  19. Spray Pyrolyzed Polycrystalline Tin Oxide Thin Film as Hydrogen Sensor

    Directory of Open Access Journals (Sweden)

    Ganesh E. Patil

    2010-09-01

    Full Text Available Polycrystalline tin oxide (SnO2 thin film was prepared by using simple and inexpensive spray pyrolysis technique (SPT. The film was characterized for their phase and morphology by X-ray diffraction (XRD and scanning electron microscopy (SEM, respectively. The crystallite size calculated from the XRD pattern is 84 nm. Conductance responses of the polycrystalline SnO2 were measured towards gases like hydrogen (H2, liquefied petroleum gas (LPG, ethanol vapors (C2H5OH, NH3, CO, CO2, Cl2 and O2. The gas sensing characteristics were obtained by measuring the sensor response as a function of various controlling factors like operating temperature, operating voltages (1 V, 5 V, 10 V 15 V, 20 V and 25 V and concentration of gases. The sensor response measurement showed that the SnO2 has maximum response to hydrogen. Furthermore; the SnO2 based sensor exhibited fast response and good recovery towards hydrogen at temperature 150 oC. The result of response towards H2 reveals that SnO2 thin film prepared by SPT would be a suitable material for the fabrication of the hydrogen sensor.

  20. Electrostrain in excess of 1% in polycrystalline piezoelectrics

    Science.gov (United States)

    Narayan, Bastola; Malhotra, Jaskaran Singh; Pandey, Rishikesh; Yaddanapudi, Krishna; Nukala, Pavan; Dkhil, Brahim; Senyshyn, Anatoliy; Ranjan, Rajeev

    2018-05-01

    Piezoelectric actuators transform electrical energy into mechanical energy, and because of their compactness, quick response time and accurate displacement, they are sought after in many applications. Polycrystalline piezoelectric ceramics are technologically more appealing than single crystals due to their simpler and less expensive processing, but have yet to display electrostrain values that exceed 1%. Here we report a material design strategy wherein the efficient switching of ferroelectric-ferroelastic domains by an electric field is exploited to achieve a high electrostrain value of 1.3% in a pseudo-ternary ferroelectric alloy system, BiFeO3-PbTiO3-LaFeO3. Detailed structural investigations reveal that this electrostrain is associated with a combination of several factors: a large spontaneous lattice strain of the piezoelectric phase, domain miniaturization, a low-symmetry ferroelectric phase and a very large reverse switching of the non-180° domains. This insight for the design of a new class of polycrystalline piezoceramics with high electrostrains may be useful to develop alternatives to costly single-crystal actuators.

  1. Semantic modeling of plastic deformation of polycrystalline rock

    Science.gov (United States)

    Babaie, Hassan A.; Davarpanah, Armita

    2018-02-01

    We have developed the first iteration of the Plastic Rock Deformation (PRD) ontology by modeling the semantics of a selected set of deformational processes and mechanisms that produce, reconfigure, displace, and/or consume the material components of inhomogeneous polycrystalline rocks. The PRD knowledge model also classifies and formalizes the properties (relations) that hold between instances of the dynamic physical and chemical processes and the rock components, the complex physio-chemical, mathematical, and informational concepts of the plastic rock deformation system, the measured or calculated laboratory testing conditions, experimental procedures and protocols, the state and system variables, and the empirical flow laws that define the inter-relationships among the variables. The ontology reuses classes and properties from several existing ontologies that are built for physics, chemistry, biology, and mathematics. With its flexible design, the PRD ontology is well positioned to incrementally develop into a model that more fully represents the knowledge of plastic deformation of polycrystalline rocks in the future. The domain ontology will be used to consistently annotate varied data and information related to the microstructures and the physical and chemical processes that produce them at different spatial and temporal scales in the laboratory and in the solid Earth. The PRDKB knowledge base, when built based on the ontology, will help the community of experimental structural geologists and metamorphic petrologists to coherently and uniformly distribute, discover, access, share, and use their data through automated reasoning and integration and query of heterogeneous experimental deformation data that originate from autonomous rock testing laboratories.

  2. Dielectric and conducting behaviour of polycrystalline holmium octa-molybdate

    International Nuclear Information System (INIS)

    Want, Basharat; Zahoor Ahmad, Bhat; Hamid Bhat, Bilal

    2014-01-01

    Polycrystalline holmium octa-molybdate spherulites have been obtained by using gel diffusion technique and characterized by different physio-chemical techniques. The surfaces of these spherulites are composed of nano-rod with an average diameter of about 80 nm. At room temperature the initial crystal structure is triclinic, space group P1. Thermal studies suggested a phase transition occurring in holmium octa-molybdate crystals at about 793 K. The electrical properties of the system have been studied as a function of frequency and temperature in the ranges of 20 Hz–3 MHz and 290–570 K, respectively. A giant dielectric constant and two loss peaks have been observed in the permittivity formalism. The conducting behaviour of the material is also discussed. The conductivity was found to be 1572 μ Ω −1 m −1 at room temperature and 3 MHz frequency. The conductivity of the polycrystalline material was attributed to the fact that it arises due to the migration of defects on the oxygen sub-lattice. Impedance studies were also performed in the frequency domain to infer the bulk and grain boundary contributions to the overall electric response of the material. The electrical responses have been attributed to the grain, grain-boundary, and interfacial effects. (paper)

  3. Shear strength of shock-loaded polycrystalline tungsten

    International Nuclear Information System (INIS)

    Asay, J.R.; Chhabildas, L.C.; Dandekar, D.P.

    1980-01-01

    Previous experiments have suggested that tungsten undergoes a significant loss of shear strength when shock loaded to stresses greater than 7 GPa. In order to investigate this effect in more detail, a series of experiments was conducted in which polycrystalline tungsten was first shock loaded to approximately 10 GPa and then either unloaded or reloaded from the shocked state. Analysis of measured time-resolved wave profiles indicates that during initial compression to 9.7 GPa, the shear stress in polycrystalline tungsten increases to a maximum value of 1.1 GPA near a longitudinal stress of 5 GPa, but decreases to a final value of 0.8 GPa for stresses approaching 10 GPa. During reloading from a longitudinal stress of 9.7 GPa to a final value of approx.14 GPa, the shear stress increases to a peak value of 1.2 GPa and softens to 1.0 GPa in the final state. During unloading from the shocked state, the initial response is elastic with a strong Baushinger effect. Examination of a recovered sample shows evidence for both deformation slipping and twinning, which may be responsible for the observed softening

  4. Three dimensional grain boundary modeling in polycrystalline plasticity

    Science.gov (United States)

    Yalçinkaya, Tuncay; Özdemir, Izzet; Fırat, Ali Osman

    2018-05-01

    At grain scale, polycrystalline materials develop heterogeneous plastic deformation fields, localizations and stress concentrations due to variation of grain orientations, geometries and defects. Development of inter-granular stresses due to misorientation are crucial for a range of grain boundary (GB) related failure mechanisms, such as stress corrosion cracking (SCC) and fatigue cracking. Local crystal plasticity finite element modelling of polycrystalline metals at micron scale results in stress jumps at the grain boundaries. Moreover, the concepts such as the transmission of dislocations between grains and strength of the grain boundaries are not included in the modelling. The higher order strain gradient crystal plasticity modelling approaches offer the possibility of defining grain boundary conditions. However, these conditions are mostly not dependent on misorientation of grains and can define only extreme cases. For a proper definition of grain boundary behavior in plasticity, a model for grain boundary behavior should be incorporated into the plasticity framework. In this context, a particular grain boundary model ([l]) is incorporated into a strain gradient crystal plasticity framework ([2]). In a 3-D setting, both bulk and grain boundary models are implemented as user-defined elements in Abaqus. The strain gradient crystal plasticity model works in the bulk elements and considers displacements and plastic slips as degree of freedoms. Interface elements model the plastic slip behavior, yet they do not possess any kind of mechanical cohesive behavior. The physical aspects of grain boundaries and the performance of the model are addressed through numerical examples.

  5. The fabrication of YBCO superconductor polycrystalline powder by CCSO

    International Nuclear Information System (INIS)

    Martirosyan, K S; Luss, D; Galstyan, E; Xue, Y Y

    2008-01-01

    We present a novel, cost-effective and simple method to produce polycrystalline superconductor YBa 2 Cu 3 O 7-δ (YBCO) powder by a self-sustaining one-step process called carbon combustion synthesis of oxides (CCSO). In this process the exothermic oxidation of carbon nanoparticles generates a thermal wave that propagates at a velocity of about 1 mm s -1 through the solid yttrium, barium, and copper precursors, converting them rapidly (in the order of seconds) to polycrystalline YBCO. The carbon is not incorporated in the product and is emitted as carbon dioxide (CO 2 ) from the sample, generating a highly porous (∼70%) and friable product. Most of the grains have a plate-like shape, are well connected, and have a size of between 1 and 3 μm. The concentration of the residual carbon was less than 0.06 wt%. The magnetization of as-synthesized samples (without external post-annealing in oxygen), as determined by a SQUID magnetometer, showed an onset of the superconducting (SC) transition at ∼91 K, with a 44% shielding fraction of the -1/(4π) value

  6. Grain-boundary unzipping by oxidation in polycrystalline graphene

    Science.gov (United States)

    Alexandre, Simone; Lucio, Aline; Nunes, Ricardo

    2011-03-01

    The need for large-scale production of graphene will inevitably lead to synthesis of the polycrystalline material [1,2]. Understanding the chemical, mechanical, and electronic properties of grain boundaries in graphene polycrystals will be crucial for the development of graphene-based electronics. Oxidation of this material has been suggested to lead to graphene ribbons, by the oxygen-driven unzipping mechanism. A cooperative-strain mechanism, based on the formation of epoxy groups along lines of parallel bonds in the hexagons of graphene's honeycomb lattice, was proposed to explain the unzipping effect in bulk graphene In this work we employ ab initio calculations to study the oxidation of polycrystalline graphene by chemisorption of oxygen at the grain boundaries. Our results indicate that oxygen tends to segregate at the boundaries, and that the unzipping mechanism is also operative along the grain boundaries, despite the lack of the parallel bonds due to the presence of fivefold and sevenfold carbon rings along the boundary core. We acknowledge support from the Brazilian agencies: CNPq, Fapemig, and INCT-Materiais de Carbono.

  7. Multiple batch recharging for industrial CZ silicon growth

    Science.gov (United States)

    Fickett, B.; Mihalik, G.

    2001-05-01

    The Czochralski (CZ) crystal growth process used in the Siemens Solar Industries’ (SSI) Vancouver, WA facility was non-continuous. Each furnace run's production was limited by the size of the starting charge. Once the charge was depleted, the furnace was shut down, cooled, and set back up for the next run. A recharge system was developed which transforms standard CZ growth into a semi-continuous process. Now when the charge is depleted, the crucible can be refilled in situ as the grown ingot is being removed from the furnace. SSI has demonstrated up to 14 recharge cycles in a single run. The resulting benefits included: significant cost reduction, increased yield, increased throughput, reduced energy consumption, improved process capability, reduced material handling requirements, and reduced labor. The recharge system also enables the use of granular silicon, which requires less than 30% of the energy required when manufacturing silicon-starting materials. This significantly reduces the energy “pay-back” time associated with SSI's finished product, photovoltaic panels.

  8. Radiation hardness of diamond and silicon sensors compared

    CERN Document Server

    de Boer, Wim; Furgeri, Alexander; Mueller, Steffen; Sander, Christian; Berdermann, Eleni; Pomorski, Michal; Huhtinen, Mika

    2007-01-01

    The radiation hardness of silicon charged particle sensors is compared with single crystal and polycrystalline diamond sensors, both experimentally and theoretically. It is shown that for Si- and C-sensors, the NIEL hypothesis, which states that the signal loss is proportional to the Non-Ionizing Energy Loss, is a good approximation to the present data. At incident proton and neutron energies well above 0.1 GeV the radiation damage is dominated by the inelastic cross section, while at non-relativistic energies the elastic cross section prevails. The smaller inelastic nucleon-Carbon cross section and the light nuclear fragments imply that at high energies diamond is an order of magnitude more radiation hard than silicon, while at energies below 0.1 GeV the difference becomes significantly smaller.

  9. Thermal Stability of Zone Melting p-Type (Bi, Sb)2Te3 Ingots and Comparison with the Corresponding Powder Metallurgy Samples

    Science.gov (United States)

    Jiang, Chengpeng; Fan, Xi'an; Hu, Jie; Feng, Bo; Xiang, Qiusheng; Li, Guangqiang; Li, Yawei; He, Zhu

    2018-04-01

    During the past few decades, Bi2Te3-based alloys have been investigated extensively because of their promising application in the area of low temperature waste heat thermoelectric power generation. However, their thermal stability must be evaluated to explore the appropriate service temperature. In this work, the thermal stability of zone melting p-type (Bi, Sb)2Te3-based ingots was investigated under different annealing treatment conditions. The effect of service temperature on the thermoelectric properties and hardness of the samples was also discussed in detail. The results showed that the grain size, density, dimension size and mass remained nearly unchanged when the service temperature was below 523 K, which suggested that the geometry size of zone melting p-type (Bi, Sb)2Te3-based materials was stable below 523 K. The power factor and Vickers hardness of the ingots also changed little and maintained good thermal stability. Unfortunately, the thermal conductivity increased with increasing annealing temperature, which resulted in an obvious decrease of the zT value. In addition, the thermal stabilities of the zone melting p-type (Bi, Sb)2Te3-based materials and the corresponding powder metallurgy samples were also compared. All evidence implied that the thermal stabilities of the zone-melted (ZMed) p-type (Bi, Sb)2Te3 ingots in terms of crystal structure, geometry size, power factor (PF) and hardness were better than those of the corresponding powder metallurgy samples. However, their thermal stabilities in terms of zT values were similar under different annealing temperatures.

  10. Energy efficiency of photovoltaic modules mono and polycrystalline in function of global solar radiation; Eficiencia energetica de modulos fotovoltaicos mono e poli-cristalinos em funcao da radiacao solar global

    Energy Technology Data Exchange (ETDEWEB)

    Seraphim, Odivaldo Jose [Universidade Estadual Paulista Julio de Mesquita Filho (UNESP), Botucatu, SP (Brazil). Fac. de Ciencias Agronomicas. Dept. de Engenharia Rural], e-mail: seraphim@fca.unesp.br; Siqueira, Jair Antonio Cruz [Universidade Estadual do Oeste do Parana (UNIOESTE), Cascavel, PR (Brazil). Centro de Ciencias Exatas e Tecnologicas], e-mail: jairsiqueira@fca.unesp.br; Silva, Carliane Diniz e [Universidade Estadual Paulista Julio de Mesquita Filho (UNESP), Botucatu, SP (Brazil); Fiorentino, Jair de Jesus [Universidade Federal de Mato Grosso do Sul (UFMS), Campo Grande, MS (Brazil). Dept. de Engenharia Eletrica], e-mail: jairfiorentino@terra.com.br; Araujo, Joao Alberto Borges de [Faculdade de Tecnologia de Botucatu (FATEC), SP (Brazil). Dept. de Engenharia de Producao

    2004-07-01

    This research proposes a methodology to evaluate the acting of the solar energy conversion in electric energy, generated by photovoltaic modules installed under field conditions, constituted monocrystalline and polycrystalline silicon cells. The modules were appraised with relationship to energy efficiency for different marks and potency levels, in function of the readiness of solar radiation, being used loads sized for the nominal potency level of each module. The energy efficiency values calculated with the data obtained in field, didn't agree with the technical information presented by the makers of the modules monocrystalline, as being more efficient than the polycrystalline. Was ended, therefore, that the modules of the appraised marks presented inferior medium efficiency at 50% of the values supplied by the makers (author)

  11. Electromechanical Response of Polycrystalline Barium Titanate Resolved at the Grain Scale

    DEFF Research Database (Denmark)

    Majkut, Marta; Daniels, John E.; Wright, Jonathan P.

    2017-01-01

    critical for understanding bulk polycrystalline ferroic behavior. Here, three-dimensional X-ray diffraction is used to reconstruct a 3D grain map (grain orientations and neighborhoods) of a polycrystalline barium titanate sample and track the grain-scale non-180° ferroelectric domain switching strains...

  12. Effect of doping on electronic states in B-doped polycrystalline CVD diamond films

    International Nuclear Information System (INIS)

    Elsherif, O S; Vernon-Parry, K D; Evans-Freeman, J H; May, P W

    2012-01-01

    High-resolution Laplace deep-level transient spectroscopy (LDLTS) and thermal admittance spectroscopy (TAS) have been used to determine the effect of boron (B) concentration on the electronic states in polycrystalline chemical vapour deposition diamond thin films grown on silicon by the hot filament method. A combination of high-resolution LDLTS and direct-capture cross-sectional measurements was used to investigate whether the deep electronic states present in the layers originated from point or extended defects. There was good agreement between data on deep electronic levels obtained from DLTS and TAS experiments. Two hole traps, E1 (0.29 eV) and E2 (0.53 eV), were found in a film with a boron content of 1 × 10 19 cm −3 . Both these levels and an additional level, E3 (0.35 eV), were found when the B content was increased to 4 × 10 19 cm −3 . Direct capture cross-sectional measurements of levels E1 and E2 show an unusual dependence on the fill-pulse duration which is interpreted as possibly indicating that the levels are part of an extended defect. The E3 level found in the more highly doped film consisted of two closely spaced levels, both of which show point-like defect characteristics. The E1 level may be due to B-related extended defects within the grain boundaries, whereas the ionization energy of the E2 level is in agreement with literature values from ab initio calculations for B–H complexes. We suggest that the E3 level is due to isolated B-related centres in bulk diamond. (paper)

  13. Visible sub-band gap photoelectron emission from nitrogen doped and undoped polycrystalline diamond films

    Energy Technology Data Exchange (ETDEWEB)

    Elfimchev, S., E-mail: sergeyel@tx.technion.ac.il; Chandran, M.; Akhvlediani, R.; Hoffman, A.

    2017-07-15

    Highlights: • Nitrogen related centers in diamond film are mainly responsible for visible sub-band-gap photoelectron emission. • The influence of film thickness and substrate on the measured photoelectron emission yields was not found. • Nanocrystalline diamonds have low electron emission yields most likely because of high amount of defects. • Visible sub-band gap photoelectron emission may increase with temperature due to electron trapping/detrapping processes. - Abstract: In this study the origin of visible sub-band gap photoelectron emission (PEE) from polycrystalline diamond films is investigated. The PEE yields as a function of temperature were studied in the wavelengths range of 360–520 nm. Based on the comparison of electron emission yields from diamond films deposited on silicon and molybdenum substrates, with different thicknesses and nitrogen doping levels, we suggested that photoelectrons are generated from nitrogen related centers in diamond. Our results show that diamond film thickness and substrate material have no significant influence on the PEE yield. We found that nanocrystalline diamond films have low electron emission yields, compared to microcrystalline diamond, due to the presence of high amount of defects in the former, which trap excited electrons before escaping into the vacuum. However, the low PEE yield of nanocrystalline diamond films was found to increase with temperature. The phenomenon was explained by the trap assisted photon enhanced thermionic emission (ta-PETE) model. According to the ta-PETE model, photoelectrons are trapped by shallow traps, followed by thermal excitation at elevated temperatures and escape into the vacuum. Activation energies of trap levels were estimated for undoped nanocrystalline, undoped microcrystalline and N-doped diamond films using the Richardson-Dushman equation, which gives 0.13, 0.39 and 0.04 eV, respectively. Such low activation energy of trap levels makes the ta-PETE process very

  14. Silicon germanium as a novel mask for silicon deep reactive ion etching

    KAUST Repository

    Serry, Mohamed Y.

    2013-10-01

    This paper reports on the use of p-type polycrystalline silicon germanium (poly-Si1-xGex) thin films as a new masking material for the cryogenic deep reactive ion etching (DRIE) of silicon. We investigated the etching behavior of various poly-Si1-xGex:B (0silicon, silicon oxide, and photoresist was determined at different etching temperatures, ICP and RF powers, and SF6 to O2 ratios. The study demonstrates that the etching selectivity of the SiGe mask for silicon depends strongly on three factors: Ge content; boron concentration; and etching temperature. Compared to conventional SiO2 and SiN masks, the proposed SiGe masking material exhibited several advantages, including high etching selectivity to silicon (>1:800). Furthermore, the SiGe mask was etched in SF6/O2 plasma at temperatures ≥ - 80°C and at rates exceeding 8 μm/min (i.e., more than 37 times faster than SiO2 or SiN masks). Because of the chemical and thermodynamic stability of the SiGe film as well as the electronic properties of the mask, it was possible to deposit the proposed film at CMOS backend compatible temperatures. The paper also confirms that the mask can easily be dry-removed after the process with high etching-rate by controlling the ICP and RF power and the SF6 to O2 ratios, and without affecting the underlying silicon substrate. Using low ICP and RF power, elevated temperatures (i.e., > - 80°C), and an adjusted O2:SF6 ratio (i.e., ~6%), we were able to etch away the SiGe mask without adversely affecting the final profile. Ultimately, we were able to develop deep silicon- trenches with high aspect ratio etching straight profiles. © 1992-2012 IEEE.

  15. Behavior of Particle Depots in Molten Silicon During Float-Zone Growth in Strong Magnetic Fields

    Science.gov (United States)

    Jauss, T.; Croell, A.; SorgenFrei, T.; Azizi, M.; Reimann, C.; Friedrich, J.; Volz, M. P.

    2014-01-01

    Solar cells made from directionally solidified silicon cover 57% of the photovoltaic industry's market [1]. One major issue during directional solidification of silicon is the precipitation of foreign phase particles. These particles, mainly SiC and Si3N4, are precipitated from the dissolved crucible coating, which is made of silicon nitride, and the dissolution of carbon monoxide from the furnace atmosphere. Due to their hardness and size of several hundred micrometers, those particles can lead to severe problems during the wire sawing process for wafering the ingots. Additionally, SiC particles can act as a shunt, short circuiting the solar cell. Even if the particles are too small to disturb the wafering process, they can lead to a grit structure of silicon micro grains and serve as sources for dislocations. All of this lowers the yield of solar cells and reduces the performance of cells and modules. We studied the behaviour of SiC particle depots during float-zone growth under an oxide skin, and strong static magnetic fields. For high field strengths of 3T and above and an oxide layer on the sample surface, convection is sufficiently suppressed to create a diffusive like regime, with strongly dampened convection [2, 3]. To investigate the difference between atomically rough phase boundaries and facetted growth, samples with [100] and [111] orientation were processed.

  16. Silicon: electrochemistry and luminescence

    NARCIS (Netherlands)

    Kooij, Ernst Stefan

    1997-01-01

    The electrochemistry of crystalline and porous silicon and the luminescence from porous silicon has been studied. One chapter deals with a model for the anodic dissolution of silicon in HF solution. In following chapters both the electrochemistry and various ways of generating visible

  17. Study of optical and luminescence properties of silicon — semiconducting silicide — silicon multilayer nanostructures

    International Nuclear Information System (INIS)

    Galkin, N.G.; Galkin, K.N.; Dotsenko, S.A.; Goroshko, D.L.; Shevlyagin, A.V.; Chusovitin, E.A.; Chernev, I.M.

    2017-01-01

    By method of in situ differential spectroscopy it was established that at the formation of monolayer Fe, Cr, Ca, Mg silicide and Mg stannide islands on the atomically clean silicon surface an appearance of loss peaks characteristic for these materials in the energy range of 1.1-2.6 eV is observed. An optimization of growth processes permit to grow monolithic double nanoheterostructures (DNHS) with embedded Fe, Cr and Ca nanocrystals, and also polycrystalline DNHS with NC of Mg silicide and Mg stannide and Ca disilicide. By methods of optical spectroscopy and Raman spectroscopy it was shown that embedded NC form intensive peaks in the reflectance spectra at energies up to 2.5 eV and Raman peaks. In DNS with β-FeSi2 NC a photoluminescence and electroluminescence at room temperature were firstly observed.

  18. Resistive switching in polycrystalline YMnO3 thin films

    Directory of Open Access Journals (Sweden)

    A. Bogusz

    2014-10-01

    Full Text Available We report a unipolar, nonvolatile resistive switching in polycrystalline YMnO3 thin films grown by pulsed laser deposition and sandwiched between Au top and Ti/Pt bottom electrodes. The ratio of the resistance in the OFF and ON state is larger than 103. The observed phenomena can be attributed to the formation and rupture of conductive filaments within the multiferroic YMnO3 film. The generation of conductive paths under applied electric field is discussed in terms of the presence of grain boundaries and charged domain walls inherently formed in hexagonal YMnO3. Our findings suggest that engineering of the ferroelectric domains might be a promising route for designing and fabrication of novel resistive switching devices.

  19. Mueller matrix mapping of biological polycrystalline layers using reference wave

    Science.gov (United States)

    Dubolazov, A.; Ushenko, O. G.; Ushenko, Yu. O.; Pidkamin, L. Y.; Sidor, M. I.; Grytsyuk, M.; Prysyazhnyuk, P. V.

    2018-01-01

    The paper consists of two parts. The first part is devoted to the short theoretical basics of the method of differential Mueller-matrix description of properties of partially depolarizing layers. It was provided the experimentally measured maps of differential matrix of the 1st order of polycrystalline structure of the histological section of brain tissue. It was defined the statistical moments of the 1st-4th orders, which characterize the distribution of matrix elements. In the second part of the paper it was provided the data of statistic analysis of birefringence and dichroism of the histological sections of mice liver tissue (normal and with diabetes). It were defined the objective criteria of differential diagnostics of diabetes.

  20. Analysis of Operating Temperature of the Polycrystalline Solar Cell

    Directory of Open Access Journals (Sweden)

    Vladimír GÁLL

    2017-12-01

    Full Text Available This work deals with the solar cells with orientation on the calculation of operating temperature of the polycrystalline solar cell, which is under actual load. Operating conditions have a significant effect on the efficiency of solar cells. In the summer with increasing temperature, the efficiency decreases. In the winter, efficiency and output voltage are rising. The operating temperature is determined by intensity of solar radiation, the types of materials used by construction and operating condition. The aim of this work was simplify of the calculation of operating temperature of solar cells. The result of this work is a derived equation that allows a more accurate and faster calculation this temperature with using Matlab software.

  1. Creep behavior for advanced polycrystalline SiC fibers

    Energy Technology Data Exchange (ETDEWEB)

    Youngblood, G.E.; Jones, R.H. [Pacific Northwest National Lab., Richland, WA (United States); Kohyama, Akira [Kyoto Univ. (Japan)] [and others

    1997-04-01

    A bend stress relaxation (BSR) test has been utilized to examine irradiation enhanced creep in polycrystalline SiC fibers which are under development for use as fiber reinforcement in SiC/SiC composite. Qualitative, S-shaped 1hr BSR curves were compared for three selected advanced SiC fiber types and standard Nicalon CG fiber. The temperature corresponding to the middle of the S-curve (where the BSR parameter m = 0.5) is a measure of a fiber`s thermal stability as well as it creep resistance. In order of decreasing thermal creep resistance, the measured transition temperatures were Nicalon S (1450{degrees}C), Sylramic (1420{degrees}C), Hi-Nicalon (1230{degrees}C) and Nicalon CG (1110{degrees}C).

  2. Microcracking in polycrystalline YBa2Cu3O7-δ

    International Nuclear Information System (INIS)

    Smith, D.S.; Suasmoro, S.; Huger, M.; Gault, C.

    1991-01-01

    The presence of microcracks can have a significant role for the electrical properties of polycrystalline YBa 2 Cu 3 O 7-δ due to the reduction of the effective current carrying cross section. This results in an increase of the normal state resistivity and a decrease of the critical current density, j c . Shaw et.al have reported an onset of microcracking for grain sizes greater than 1-2 μm. In this work we focus attention on the geometrical aspects of the microstructure by using ultrasonic measurements to characterize the mechanical properties of the ceramic for comparison to the electrical data. The studies have been extended with experiments as a function of temperature and atmosphere in order to investigate the origins of the microcracks. (orig./BHO)

  3. Characterization of CdSe polycrystalline films by photoluminescence spectroscopy

    International Nuclear Information System (INIS)

    Brasil, M.J.S.P.

    1985-01-01

    The characterization of CdSe polycristalline films were done by photoluminescence spectroscopy, X-ray diffraction analysis, diagrams IxV, and efficiency of solar energy conversion for cells done by these films. The experimental data shown strong temperature dependence of annealing, and the optimum temperature around 650 0 C was determined. The films did not present photoluminescence before heat treatment, but the annealed sample spectrum showed fine structures in the excitonic region, crystal phase transformation, enhancement of grain size, and better efficiency of the cell. Measurements of photoluminescence between 2 and 300 K, showed two bands of infrared emission, width and intense enough. The shape, at half-width, and the integrated intensity of one these bands were described by a configuration coordinate model for deep centers. Based on obtained results, some hypothesis about the origin of these bands and its correlation with efficiency of cells done with CdSe polycrystalline films, are proposed. (M.C.K.) [pt

  4. Mechanical properties of amorphous and polycrystalline multilayer systems

    International Nuclear Information System (INIS)

    Barzen, I.; Edinger, M.; Scherer, J.; Ulrich, S.; Jung, K.; Ehrhardt, H.

    1993-01-01

    Amorphous and polycrystalline multilayer structures containing materials with metallic (Cr, Cr 3 C 2 ), ionic (Al 2 O 3 ) and covalent (SiC) bonding have been prepared by magnetron sputtering and ion plating in a dual-source apparatus. Up to 1000 layers have been deposited with a constant total thickness of 2.3 μm. Below a single-layer thickness of 10-30 nm the mechanical properties stress and hardness show strong variations. On one hand it is possible that below a certain thickness the mechanical properties of a single layer change. On the other hand electrical resistance and electron spin density measurements indicate that electronic effects may be involved. An attempt is made to explain the observed correlations by transport mechanisms of the electrons, by saturation of dangling bonds with delocalized electrons and by changes in the electronic band structure. (orig.)

  5. Polycrystalline Diamond Coating of Additively Manufactured Titanium for Biomedical Applications.

    Science.gov (United States)

    Rifai, Aaqil; Tran, Nhiem; Lau, Desmond W; Elbourne, Aaron; Zhan, Hualin; Stacey, Alastair D; Mayes, Edwin L H; Sarker, Avik; Ivanova, Elena P; Crawford, Russell J; Tran, Phong A; Gibson, Brant C; Greentree, Andrew D; Pirogova, Elena; Fox, Kate

    2018-03-14

    Additive manufacturing using selective laser melted titanium (SLM-Ti) is used to create bespoke items across many diverse fields such as medicine, defense, and aerospace. Despite great progress in orthopedic implant applications, such as for "just in time" implants, significant challenges remain with regards to material osseointegration and the susceptibility to bacterial colonization on the implant. Here, we show that polycrystalline diamond coatings on these titanium samples can enhance biological scaffold interaction improving medical implant applicability. The highly conformable coating exhibited excellent bonding to the substrate. Relative to uncoated SLM-Ti, the diamond coated samples showed enhanced mammalian cell growth, enriched apatite deposition, and reduced microbial S. aureus activity. These results open new opportunities for novel coatings on SLM-Ti devices in general and especially show promise for improved biomedical implants.

  6. Structural Evolution and Mechanisms of Fatigue in Polycrystalline Brass

    DEFF Research Database (Denmark)

    Carstensen, Jesper Vejlø

    The plastic strain controlled fatigue behaviour of polycrystalline Cu-15%Zn and Cu-30%Zn has been investigated with the aim of studying the effect of slip mode modification by the addition of zinc to copper. It has been clearly demonstrated, that true cyclic saturation does not occur in the plastic...... type single slip. This behaviour has been described by the self-consistent Sachs-Eshelby model, which provides estimates of the CSS curve for brass polycrystals. Successive stages of primary hardening, softening and secondary hardening has been observed in the plastic strain controlled fatigue of brass....... It has been found that the primary hardening is attributed to an increase of intergranular stresses whereas the sec-ondary hardening apparently is attributed to an increase of friction stresses. Investigations of the structural evolution show that the softening behaviour can be explained by the presence...

  7. X-ray stress analysis in textured polycrystalline materials

    International Nuclear Information System (INIS)

    Yokoyama, Ryouichi; Harada, Jimpei

    2010-01-01

    The relationship between stress and strain in polycrystalline materials with fibre texture is examined on the basis of the strain analysis in the constituent crystallites within the Reuss approximation. By introducing the symmetry of reciprocal lattices for the constituent crystallites, the physical meaning of taking an average of the strains observed by X-ray diffraction (XRD) is made clear. By using formulae obtained by the present treatment for the stress-strain relation in cubic specimens with fibre texture in the Laue classes m3-bar m hkl Bragg reflections with h≠k≠l split into doublets owing to the existence of crystallites with two different orientations under the stress field. This technique was confirmed by the profile analysis in XRD data observed for reflections of 222 and 420 in a cubic TiN thin film sputtered on a polyimide film. The technique of the stress analysis and its confirmation are introduced. (author)

  8. Wavelet analysis of polarization maps of polycrystalline biological fluids networks

    Science.gov (United States)

    Ushenko, Y. A.

    2011-12-01

    The optical model of human joints synovial fluid is proposed. The statistic (statistic moments), correlation (autocorrelation function) and self-similar (Log-Log dependencies of power spectrum) structure of polarization two-dimensional distributions (polarization maps) of synovial fluid has been analyzed. It has been shown that differentiation of polarization maps of joint synovial fluid with different physiological state samples is expected of scale-discriminative analysis. To mark out of small-scale domain structure of synovial fluid polarization maps, the wavelet analysis has been used. The set of parameters, which characterize statistic, correlation and self-similar structure of wavelet coefficients' distributions of different scales of polarization domains for diagnostics and differentiation of polycrystalline network transformation connected with the pathological processes, has been determined.

  9. Dislocation structures around crack tips of fatigued polycrystalline copper

    International Nuclear Information System (INIS)

    Kaneko, Yoshihisa; Ishikawa, Masao; Hashimoto, Satoshi

    2005-01-01

    Dislocation structures near fatigue cracks of polycrystalline copper specimens were analyzed using the electron channelling contrast imaging (ECCI) technique. Prior to the ECCI observations, optical microscopy was conducted to classify the fatigue crack morphologies into several kinds. It was found that the dislocation structures were correlated with the slip morphologies observed using the optical microscope. The cell structure almost corresponded to the severely deformed plastic zone where the individual slip bands could not be identified. The labyrinth dislocation structure was detected at the double-slip region. Ladder-like dislocation structure was detected ahead of the Stage I type fatigue crack. Hence, it can be said that the persistent slip band (PSB) was a favorable crack path. However, the microscopic route of the crack growth was not along the PSB but along the cell structure, which was developed locally in the vicinity of the crack tip

  10. Slip activity of persistent slip bands in polycrystalline nickel

    International Nuclear Information System (INIS)

    Weidner, A.; Beyer, R.; Blochwitz, C.; Holste, C.; Schwab, A.; Tirschler, W.

    2006-01-01

    The appearance of glide localizations after cyclic deformation in the saturation stage was investigated for polycrystalline nickel. It was shown that persistent slip bands (PSBs) are formed in a wide range of grain orientations. Concerning the grain size it was found, that the probability for the appearance of PSBs is higher for larger grains. The local slip activity of the formed PSBs was studied after half-cycle deformation using atomic force microscopy (AFM) and scanning electron microscopy (SEM). The fraction of grains with glide-active PSBs and the glide-active PSB volume itself is very small after the half-cycle loading. The obtained local shear strain amplitudes are quite high and vary in the range of 0.2-5%. They are comparable with those found in nickel single crystals at the same loading procedure

  11. Surface roughness effects on blister formation in polycrystalline molybdenum

    International Nuclear Information System (INIS)

    Saidoh, Masahiro; Sone, Kazuho; Yamada, Rayji; Ohtsuka, Hidewo; Murakami, Yoshio

    1977-07-01

    Polycrystalline molybdenum targets with electropolished and roughened surfaces were bombarded with 100 keV He + and 200 keV H 2 + ions at room temperature. It has been demonstrated that the blister formation is largely or completely suppressed by roughening the electropolished surface with emery paper of No. 1200, No. 400 and No. 100. Up to a He + fluence of 1.0 x 10 19 particles/cm 2 , no blisters are observed in the targets with the two roughest surfaces, while on the smooth surface blisters begin to occur at a fluence of 7.5 x 10 17 particles/cm 2 . The surface roughness effect on blister suppression is discussed in relation to the projected range of incident particles. (auth.)

  12. Sputtering mechanisms of polycrystalline platinum by low energy ions

    International Nuclear Information System (INIS)

    Chernysh, V.S.; Eckstein, W.; Haidarov, A.A.; Kulikauskas, V.S.; Mashkova, E.S.; Molchanov, V.A.

    1999-01-01

    The results of an experimental study and a computer simulation with the TRIM.SP code of the angular distributions of atoms sputtered from polycrystalline platinum under 1.5-9 keV He + bombardment at the normal ion incidence are presented. It has been found that angular distributions of sputtered atoms are overcosine and that their shape is practically independent of the bombarding ion species and ion energy. Good agreement between experimental results and computer simulation data was found. Computer simulations of the partial angular distributions of Pt atoms ejected due to various sputtering mechanisms for He and Ar bombardments were performed. The role of different mechanisms in the formation of angular distributions of sputtered atoms has been analyzed

  13. Polycrystalline CdTe solar cells on elastic substrates

    International Nuclear Information System (INIS)

    Sibinski, M.; Lisik, Z.

    2007-01-01

    The presented article is a report on progress in photovoltaic devices and material processing. A cadmium telluride solar cell as one of the most attractive option for thin-film polycrystalline cell constructions is presented. All typical manufacturing steps of this device, including recrystallisation and junction activation are explained. A new potential field of application for this kind of device - the BIPV (Building Integrated Photovoltaic) is named and discussed. All possible configuration options for this application, according to material properties and exploitation demands are considered. The experimental part of the presented paper is focused on practical implementation of the high - temperature polymer foil as the substrate of the newly designed device by the help of ICSVT (Isothermal Close Space Vapour Transport) technique. The evaluation of the polyester and polyamide foils according to the ICSVT/CSS manufacturing process parameters is described and discussed. A final conclusion on practical verification of these materials is also given. (authors)

  14. Electronic properties of polycrystalline graphene under large local strain

    International Nuclear Information System (INIS)

    He, Xin; Tang, Ning; Duan, Junxi; Mei, Fuhong; Meng, Hu; Lu, Fangchao; Xu, Fujun; Yang, Xuelin; Gao, Li; Wang, Xinqiang; Shen, Bo; Ge, Weikun

    2014-01-01

    To explore the transport properties of polycrystalline graphene under large tensile strain, a strain device has been fabricated using piezocrystal to load local strain onto graphene, up to 22.5%. Ionic liquid gate whose capability of tuning carrier density being much higher than that of a solid gate is used to survey the transfer characteristics of the deformed graphene. The conductance of the Dirac point and field effect mobility of electrons and holes is found to decrease with increasing strain, which is attributed to the scattering of the graphene grain boundaries, the strain induced change of band structure, and defects. However, the transport gap is still not opened. Our study is helpful to evaluate the application of graphene in stretchable electronics.

  15. Improved orientation sampling for indexing diffraction patterns of polycrystalline materials

    DEFF Research Database (Denmark)

    Larsen, Peter Mahler; Schmidt, Søren

    2017-01-01

    to that of optimally distributing points on a four‐dimensional sphere. In doing so, the number of orientation samples needed to achieve a desired indexing accuracy is significantly reduced. Orientation sets at a range of sizes are generated in this way for all Laue groups and are made available online for easy use.......Orientation mapping is a widely used technique for revealing the microstructure of a polycrystalline sample. The crystalline orientation at each point in the sample is determined by analysis of the diffraction pattern, a process known as pattern indexing. A recent development in pattern indexing...... in the presence of noise, it has very high computational requirements. In this article, the computational burden is reduced by developing a method for nearly optimal sampling of orientations. By using the quaternion representation of orientations, it is shown that the optimal sampling problem is equivalent...

  16. Brine migration in hot-pressed polycrystalline sodium chloride

    International Nuclear Information System (INIS)

    Biggers, J.V.; Dayton, G.O.

    1982-12-01

    This report describes experiments designed to provide data on brine migration in polycrystalline salt. Polycrystalling samples of various grain sizes, density, and purity were prepared from several commercial-grade salts by hot-pressing. Three distinct experimental set-ups were used to place salt billets in an induced thermal gradient in contact with brine source. The test designs varied primarily in the way in which the thermal gradient was applied and monitored and the way in which brine migration was determined. All migration was in enclosed vessels which precluded visual observation of brine movement through the microstructure. Migration velocities were estimated either by the timed appearance of brine at the hot face of the sample, or by determination of the penetration distance of migration artifacts in the microstructure after tests of fixed duration. For various reasons both of these methods were subject to a large degree of error. Our results suggest, however, that the migration velocity in dense polycrystalline salt may be at least an order of magnitude greater than that suggested by single-crystal experiments. Microstructural analysis shows that brine prefers to migrate along paths of high crystalline activity such as grain and subgrain boundaries and is dispersed rather quickly in the microstructure. A series of tests were performed using various types of tracers in brine in order to flag migration paths and locate brine in the microstructure more decisively. These attempts failed and it appears that only the aqueous portion of the brine moves through the microstructure with the dissolved ions being lost and replaced rather quickly. This suggests the use of deuterium as a tracer in future work

  17. Physically-based modelling of polycrystalline semiconductor devices

    International Nuclear Information System (INIS)

    Lee, S.

    2000-01-01

    Thin-film technology using polycrystalline semiconductors has been widely applied to active-matrix-addressed liquid crystal displays (AMLCDs) where thin-film transistors act as digital pixel switches. Research and development is in progress to integrate the driver circuits around the peripheral of the display, resulting in significant cost reduction of connections between rows and columns and the peripheral circuitry. For this latter application, where for instance it is important to control the greyscale voltage level delivered to the pixel, an understanding of device behaviour is required so that models can be developed for analogue circuit simulation. For this purpose, various analytical models have been developed based on that of Seto who considered the effect of monoenergetic trap states and grain boundaries in polycrystalline materials but not the contribution of the grains to the electrical properties. The principal aim of this thesis is to describe the use of a numerical device simulator (ATLAS) as a tool to investigate the physics of the trapping process involved in the device operation, which additionally takes into account the effect of multienergetic trapping levels and the contribution of the grain into the modelling. A study of the conventional analytical models is presented, and an alternative approach is introduced which takes into account the grain regions to enhance the accuracy of the analytical modelling. A physically-based discrete-grain-boundary model and characterisation method are introduced to study the effects of the multienergetic trap states on the electrical characteristics of poly-TFTs using CdSe devices as the experimental example, and the electrical parameters such as the density distribution of the trapping states are extracted. The results show excellent agreement between the simulation and experimental data. The limitations of this proposed physical model are also studied and discussed. (author)

  18. Low resistance polycrystalline diamond thin films deposited by hot ...

    Indian Academy of Sciences (India)

    Administrator

    silicon wafers using a hydrocarbon gas (CH4) highly diluted with H2 at low pressure in a hot filament chemi- cal vapour ... the laser spot was focused on the sample surface using a ... tative spectra of diamond thin films with a typical dia-.

  19. The chemistry of silicon

    CERN Document Server

    Rochow, E G; Emeléus, H J; Nyholm, Ronald

    1975-01-01

    Pergamon Texts in Organic Chemistry, Volume 9: The Chemistry of Silicon presents information essential in understanding the chemical properties of silicon. The book first covers the fundamental aspects of silicon, such as its nuclear, physical, and chemical properties. The text also details the history of silicon, its occurrence and distribution, and applications. Next, the selection enumerates the compounds and complexes of silicon, along with organosilicon compounds. The text will be of great interest to chemists and chemical engineers. Other researchers working on research study involving s

  20. Silicon Microspheres Photonics

    International Nuclear Information System (INIS)

    Serpenguzel, A.

    2008-01-01

    Electrophotonic integrated circuits (EPICs), or alternatively, optoelectronic integrated circuit (OEICs) are the natural evolution of the microelectronic integrated circuit (IC) with the addition of photonic capabilities. Traditionally, the IC industry has been based on group IV silicon, whereas the photonics industry on group III-V semiconductors. However, silicon based photonic microdevices have been making strands in siliconizing photonics. Silicon microspheres with their high quality factor whispering gallery modes (WGMs), are ideal candidates for wavelength division multiplexing (WDM) applications in the standard near-infrared communication bands. In this work, we will discuss the possibility of using silicon microspheres for photonics applications in the near-infrared