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Sample records for polarized total-reflection x-ray

  1. Total-reflection X-ray fluorescence analysis of Austrian wine

    International Nuclear Information System (INIS)

    Gruber, X.; Kregsamer, P.; Wobrauschek, P.; Streli, C.

    2006-01-01

    The concentration of major, minor and trace elements in Austrian wine was determined by total-reflection X-ray fluorescence using gallium as internal standard. A multi-elemental analysis was possible by pipetting 6 μl of wine directly on the reflector and drying. Total-reflection X-ray fluorescence analysis was performed with Atomika EXTRA II A (Cameca) X-rays from a Mo tube with a high-energy cut-off at 20 keV in total-reflection geometry. The results showed that it was possible to identify only by the elemental analysis as fingerprint the vineyards and year of vintage among 11 different wines

  2. Total-reflection X-ray fluorescence analysis of Austrian wine

    Energy Technology Data Exchange (ETDEWEB)

    Gruber, X. [Atominstitut der Osterreichischen Universitaeten, 1020 Vienna (Austria); Kregsamer, P. [Atominstitut der Osterreichischen Universitaeten, 1020 Vienna (Austria); Wobrauschek, P. [Atominstitut der Osterreichischen Universitaeten, 1020 Vienna (Austria); Streli, C. [Atominstitut der Osterreichischen Universitaeten, 1020 Vienna (Austria)]. E-mail: streli@ati.ac.at

    2006-11-15

    The concentration of major, minor and trace elements in Austrian wine was determined by total-reflection X-ray fluorescence using gallium as internal standard. A multi-elemental analysis was possible by pipetting 6 {mu}l of wine directly on the reflector and drying. Total-reflection X-ray fluorescence analysis was performed with Atomika EXTRA II A (Cameca) X-rays from a Mo tube with a high-energy cut-off at 20 keV in total-reflection geometry. The results showed that it was possible to identify only by the elemental analysis as fingerprint the vineyards and year of vintage among 11 different wines.

  3. Total reflection X-ray fluorescence analysis

    International Nuclear Information System (INIS)

    Michaelis, W.; Prange, A.

    1987-01-01

    In the past few years, total reflection X-ray flourescence analysis (TXRF) has found an increasing number of assignments and applications. Experience of trace element analysis using TXRF and examples of applications are already widespread. Therefore, users of TXRF had the opportunity of an intensive exchange of their experience at the 1st workshop on total reflection X-ray fluorescence analysis which took place on May 27th and 28th 1986 at the GKSS Research Centre at Geesthacht. In a series of lectures and discussions dealing with the analytical principle itself, sample preparation techniques and applications as well as comuter programs for spectrum evaluation, the present state of development and the range of applications were outlined. 3 studies out of a total of 14 were included separately in the INIS and ENERGY databases. With 61 figs., 12 tabs [de

  4. Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structure

    Energy Technology Data Exchange (ETDEWEB)

    Fittschen, U.E.A. [Department of Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany)], E-mail: ursula.fittschen@chemie.uni-hamburg.de; Meirer, F. [Atominstitut, Vienna University of Technology, Stadionallee 2, 1020 Wien (Austria)], E-mail: fmeirer@ati.ac.at; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, 1020 Wien (Austria)], E-mail: streli@ati.ac.at; Wobrauschek, P. [Atominstitut, Vienna University of Technology, Stadionallee 2, 1020 Wien (Austria)], E-mail: wobi@ati.ac.at; Thiele, J. [Department of Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany)], E-mail: Julian.Thiele@gmx.de; Falkenberg, G. [Hamburger Synchrotronstrahlungslabor at Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22603 Hamburg (Germany)], E-mail: falkenbe@mail.desy.de; Pepponi, G. [ITC-irst, Via Sommarive 18, 38050 Povo (Trento) (Italy)], E-mail: pepponi@itc.it

    2008-12-15

    In this study a new procedure using Synchrotron total reflection X-ray fluorescence (SR-TXRF) to characterize elemental amounts in atmospheric aerosols down to particle sizes of 0.015 um is presented. The procedure was thoroughly evaluated regarding bounce off effects and blank values. Additionally the potential of total reflection X-ray fluorescence-X-ray absorption near edge structure (SR-TXRF-XANES) for speciation of FeII/III down to amounts of 34 pg in aerosols which were collected for 1 h is shown. The aerosols were collected in the city of Hamburg with a low pressure Berner impactor on Si carriers covered with silicone over time periods of 60 and 20 min each. The particles were collected in four and ten size fractions of 10.0-8.0 {mu}m, 8.0-2.0 {mu}m, 2.0-0.13 {mu}m 0.13-0.015 {mu}m (aerodynamic particle size) and 15-30 nm, 30-60 nm, 60-130 nm, 130-250 nm, 250-500 nm, 0.5-1 {mu}m, 1-2 {mu}m, 2-4 {mu}m, 4-8 {mu}m, 8-16 {mu}m. Prior to the sampling 'bounce off' effects on Silicone and Vaseline coated Si carriers were studied with total reflection X-ray fluorescence. According to the results silicone coated carriers were chosen for the analysis. Additionally, blank levels originating from the sampling device and the calibration procedure were studied. Blank levels of Fe corresponded to 1-10% of Fe in the aerosol samples. Blank levels stemming from the internal standard were found to be negligible. The results from the Synchroton radiation total reflection X-ray fluorescence analysis of the aerosols showed that 20 min of sampling time gave still enough sample material for elemental determination of most elements. For the determination of the oxidation state of Fe in the aerosols different Fe salts were prepared as a reference from suspensions in isopropanol. The results from the Fe K-edge Synchroton radiation total reflection X-ray fluorescence-X-ray absorption near-edge structure analysis of the aerosol samples showed that mainly Fe(III) was present in

  5. Characterization of atmospheric aerosols using Synchroton radiation total reflection X-ray fluorescence and Fe K-edge total reflection X-ray fluorescence-X-ray absorption near-edge structure

    International Nuclear Information System (INIS)

    Fittschen, U.E.A.; Meirer, F.; Streli, C.; Wobrauschek, P.; Thiele, J.; Falkenberg, G.; Pepponi, G.

    2008-01-01

    In this study a new procedure using Synchrotron total reflection X-ray fluorescence (SR-TXRF) to characterize elemental amounts in atmospheric aerosols down to particle sizes of 0.015 um is presented. The procedure was thoroughly evaluated regarding bounce off effects and blank values. Additionally the potential of total reflection X-ray fluorescence-X-ray absorption near edge structure (SR-TXRF-XANES) for speciation of FeII/III down to amounts of 34 pg in aerosols which were collected for 1 h is shown. The aerosols were collected in the city of Hamburg with a low pressure Berner impactor on Si carriers covered with silicone over time periods of 60 and 20 min each. The particles were collected in four and ten size fractions of 10.0-8.0 μm, 8.0-2.0 μm, 2.0-0.13 μm 0.13-0.015 μm (aerodynamic particle size) and 15-30 nm, 30-60 nm, 60-130 nm, 130-250 nm, 250-500 nm, 0.5-1 μm, 1-2 μm, 2-4 μm, 4-8 μm, 8-16 μm. Prior to the sampling 'bounce off' effects on Silicone and Vaseline coated Si carriers were studied with total reflection X-ray fluorescence. According to the results silicone coated carriers were chosen for the analysis. Additionally, blank levels originating from the sampling device and the calibration procedure were studied. Blank levels of Fe corresponded to 1-10% of Fe in the aerosol samples. Blank levels stemming from the internal standard were found to be negligible. The results from the Synchroton radiation total reflection X-ray fluorescence analysis of the aerosols showed that 20 min of sampling time gave still enough sample material for elemental determination of most elements. For the determination of the oxidation state of Fe in the aerosols different Fe salts were prepared as a reference from suspensions in isopropanol. The results from the Fe K-edge Synchroton radiation total reflection X-ray fluorescence-X-ray absorption near-edge structure analysis of the aerosol samples showed that mainly Fe(III) was present in all particle size fractions

  6. Total reflection X-ray photoelectron spectroscopy: A review

    International Nuclear Information System (INIS)

    Kawai, Jun

    2010-01-01

    Total reflection X-ray photoelectron spectroscopy (TRXPS) is reviewed and all the published papers on TRXPS until the end of 2009 are included. Special emphasis is on the historical development. Applications are also described for each report. The background reduction is the most important effect of total reflection, but interference effect, relation to inelastic mean free path, change of probing depth are also discussed.

  7. Surface characterization of selected polymer thin films by total-reflection x-ray fluorescence spectroscopy and x-ray reflectivity

    International Nuclear Information System (INIS)

    Innis, Vallerie Ann A.

    2006-01-01

    Development of available x-ray characterizations tools for grazing incidence techniques was done to be able to probe nano-size thin films. Alignment of a Philips x-ray powder diffractometer was improved to let it perform as an x-ray reflectometer. X-ray reflectometry was coupled with total-reflection x-ray fluorescence spectroscopy. Evaluation of the performance of this grazing incidence techniques was done by preparing polymer thin films of carboxymethylcellulose, carrageenan and polyvinylpyrrolidone (PVP). The thickness of the films were varied by varying the process parameters such as concentration, spin speed and spin time. Angle-dispersive total-reflection x-ray fluorescence spectroscopy profiles of three films showed film formation only in carrageenan and PVP. For both carrageenan and PVP, an increase in concentration yielded a corresponding increase in intensity of the fluorescent or scattered peaks. XRR profiles of carrageenan thin films yielded a mean value for the critical angle close to quartz substrate. Thickness measurements of the prepared carrageenan thin films showed that concentration was the main determinant for final film thickness over the other process parameters. Sulfur fluorescent intensity derived from the TXRF measurement showed a linear relationship with the measured thickness by XRR. For PVP, measured critical angle is lower than quartz. Poor adhesion of the polymer onto the substrate yielded a limited number of thickness measurements made from the XRR profiles. (Author)

  8. Analysis of archaeological ceramics by total-reflection X-ray fluorescence: Quantitative approaches

    International Nuclear Information System (INIS)

    Fernandez-Ruiz, R.; Garcia-Heras, M.

    2008-01-01

    This paper reports the quantitative methodologies developed for the compositional characterization of archaeological ceramics by total-reflection X-ray fluorescence at two levels. A first quantitative level which comprises an acid leaching procedure, and a second selective level, which seeks to increase the number of detectable elements by eliminating the iron present in the acid leaching procedure. Total-reflection X-ray fluorescence spectrometry has been compared, at a quantitative level, with Instrumental Neutron Activation Analysis in order to test its applicability to the study of this kind of materials. The combination of a solid chemical homogenization procedure previously reported with the quantitative methodologies here presented allows the total-reflection X-ray fluorescence to analyze 29 elements with acceptable analytical recoveries and accuracies

  9. Analysis of archaeological ceramics by total-reflection X-ray fluorescence: Quantitative approaches

    Energy Technology Data Exchange (ETDEWEB)

    Fernandez-Ruiz, R. [Servicio Interdepartamental de Investigacion, Facultad de Ciencias, Universidad Autonoma de Madrid, Modulo C-9, Laboratorio de TXRF, Crta. Colmenar, Km 15, Cantoblanco, E-28049, Madrid (Spain)], E-mail: ramon.fernandez@uam.es; Garcia-Heras, M. [Grupo de Arqueometria de Vidrios y Materiales Ceramicos, Instituto de Historia, Centro de Ciencias Humanas y Sociales, CSIC, C/ Albasanz, 26-28, 28037 Madrid (Spain)

    2008-09-15

    This paper reports the quantitative methodologies developed for the compositional characterization of archaeological ceramics by total-reflection X-ray fluorescence at two levels. A first quantitative level which comprises an acid leaching procedure, and a second selective level, which seeks to increase the number of detectable elements by eliminating the iron present in the acid leaching procedure. Total-reflection X-ray fluorescence spectrometry has been compared, at a quantitative level, with Instrumental Neutron Activation Analysis in order to test its applicability to the study of this kind of materials. The combination of a solid chemical homogenization procedure previously reported with the quantitative methodologies here presented allows the total-reflection X-ray fluorescence to analyze 29 elements with acceptable analytical recoveries and accuracies.

  10. Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples

    International Nuclear Information System (INIS)

    Dhara, Sangita; Misra, N.L.; Maind, S.D.; Kumar, Sanjukta A.; Chattopadhyay, N.; Aggarwal, S.K.

    2010-01-01

    The possibility of applying Total Reflection X-ray Fluorescence for qualitative and quantitative differentiation of documents printed with rare earth tagged and untagged inks has been explored in this paper. For qualitative differentiation, a very small amount of ink was loosened from the printed documents by smoothly rubbing with a new clean blade without destroying the manuscript. 50 μL of Milli-Q water was put on this loose powder, on the manuscript, and was agitated by sucking and releasing the suspension two to three times with the help of a micropipette. The resultant dispersion was deposited on quartz sample support for Total Reflection X-ray Fluorescence measurements. The Total Reflection X-ray Fluorescence spectrum of tagged and untagged inks could be clearly differentiated. In order to see the applicability of Total Reflection X-ray Fluorescence for quantitative determinations of rare earths and also to countercheck such determinations in ink samples, the amounts of rare earth in painted papers with single rare earth tagged inks were determined by digesting the painted paper in HNO 3 /HClO 4 , mixing this solution with the internal standard and recording their Total Reflection X-ray Fluorescence spectra after calibration of the instrument. The results thus obtained were compared with those obtained by Inductively Coupled Plasma Mass Spectrometry and were found in good agreement. The average precision of the Total Reflection X-ray Fluorescence determinations was 5.5% (1σ) and the average deviation of Total Reflection X-ray Fluorescence determined values with that of Inductively Coupled Plasma Mass Spectrometry was 7.3%. These studies have shown that Total Reflection X-ray Fluorescence offers a promising and potential application in forensic work of this nature.

  11. Forensic application of total reflection X-ray fluorescence spectrometry for elemental characterization of ink samples

    Energy Technology Data Exchange (ETDEWEB)

    Dhara, Sangita [Fuel Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Misra, N.L., E-mail: nlmisra@barc.gov.i [Fuel Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Maind, S.D. [NAA Unit of Central Forensic Science Laboratory Hyderabad at Analytical Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Kumar, Sanjukta A. [Analytical Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Chattopadhyay, N. [NAA Unit of Central Forensic Science Laboratory Hyderabad at Analytical Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India); Aggarwal, S.K. [Fuel Chemistry Division, Bhabha Atomic Research Centre, Mumbai 400 085 (India)

    2010-02-15

    The possibility of applying Total Reflection X-ray Fluorescence for qualitative and quantitative differentiation of documents printed with rare earth tagged and untagged inks has been explored in this paper. For qualitative differentiation, a very small amount of ink was loosened from the printed documents by smoothly rubbing with a new clean blade without destroying the manuscript. 50 muL of Milli-Q water was put on this loose powder, on the manuscript, and was agitated by sucking and releasing the suspension two to three times with the help of a micropipette. The resultant dispersion was deposited on quartz sample support for Total Reflection X-ray Fluorescence measurements. The Total Reflection X-ray Fluorescence spectrum of tagged and untagged inks could be clearly differentiated. In order to see the applicability of Total Reflection X-ray Fluorescence for quantitative determinations of rare earths and also to countercheck such determinations in ink samples, the amounts of rare earth in painted papers with single rare earth tagged inks were determined by digesting the painted paper in HNO{sub 3}/HClO{sub 4}, mixing this solution with the internal standard and recording their Total Reflection X-ray Fluorescence spectra after calibration of the instrument. The results thus obtained were compared with those obtained by Inductively Coupled Plasma Mass Spectrometry and were found in good agreement. The average precision of the Total Reflection X-ray Fluorescence determinations was 5.5% (1sigma) and the average deviation of Total Reflection X-ray Fluorescence determined values with that of Inductively Coupled Plasma Mass Spectrometry was 7.3%. These studies have shown that Total Reflection X-ray Fluorescence offers a promising and potential application in forensic work of this nature.

  12. Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Watanabe, Yoshihide, E-mail: e0827@mosk.tytlabs.co.jp; Nishimura, Yusaku F.; Suzuki, Ryo; Beniya, Atsushi; Isomura, Noritake [Toyota Central R& D Labs., Inc., Yokomichi 41-1, Nagakute, Aichi 480-1192 (Japan); Uehara, Hiromitsu; Asakura, Kiyotaka; Takakusagi, Satoru [Catalysis Research Center, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021 (Japan); Nimura, Tomoyuki [AVC Co., Ltd., Inada 1450-6, Hitachinaka, Ibaraki 312-0061 (Japan)

    2016-03-15

    A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt{sub 4} clusters deposited on a TiO{sub 2}(110) surface.

  13. Development of a total reflection X-ray fluorescence spectrometer for ...

    Indian Academy of Sciences (India)

    Unknown

    design and use of a peltier cooled solid state detector for energy dispersive detection. Alignment and ... X-ray beam at a glancing angle less than the critical angle at which total ... materials is < 1 so that external total reflection takes place at an ...

  14. Total-reflection x-ray fluorescence with a brillant undulator x-ray source

    International Nuclear Information System (INIS)

    Sakurai, K.; Eba, H.; Numako, C.; Suzuki, M.; Inoue, K.; Yagi, N.

    2000-01-01

    Total-reflection x-ray fluorescence (TXRF) is a highly sensitive technique for analyzing trace elements, because of the very low background from the sample support. Use of third-generation synchrotron x-ray source could further enhance the detection power. However, while such high sensitivity permits the detection of signals from trace elements of interest, it also means that one can observe weak parasitic x-rays as well. If the sample surface becomes even slightly contaminated, owing to air particulates near the beamline, x-ray fluorescence lines of iron, zinc, copper, nickel, chromium, and titanium can be observed even for a blank sample. Another critical problem is the low-energy-side tail of the scattering x-rays, which ultimately restricts the detection capability of the technique using a TXRF spectrometer based on a Si(Li) detector. The present paper describes our experiments with brilliant undulator x-ray beams at BL39XU and BL40XU, at the SPring-8, Harima, Japan. The emphasis is on the development of instruments to analyze a droplet of 0.1 μl containing trace elements of ppb level. Although the beamline is not a clean room, we have employed equipment for preparing a clean sample and also for avoiding contamination during transferring the sample into the spectrometer. We will report on the successful detection of the peak from 0.8 ppb selenium in a droplet (absolute amount 80 fg). We will also present the results of recent experiments obtained from a Johansson spectrometer rather than a Si(Li) detector. (author)

  15. Sweeping total reflection X-ray fluorescence optimisation to monitor the metallic contamination into IC manufacturing

    International Nuclear Information System (INIS)

    Borde, Yannick; Danel, Adrien; Roche, Agnes; Veillerot, Marc

    2008-01-01

    Among the methods available on the market today to control as metallic contamination in integrated circuit manufacturing, Sweeping Total reflection X-ray Fluorescence mode appears a very good method, providing fast and entire wafer mapping. With the goal of a pertinent use of Sweeping Total reflection X-ray Fluorescence in advanced Integrated Circuit manufacturing this work discusses how acceptable levels of contamination specified by the production (low levels to be detected) can be taken into account. The relation between measurement results (surface coverage, throughput, low limit of detection, limit of quantification, quantification of localized contamination) and Sweeping Total reflection X-ray Fluorescence parameters (number of measurement points and integration time per point) is presented in details. In particular, a model is proposed to explain the mismatch between actual surface contamination in a localized spot on wafer and Total reflection X-ray Fluorescence reading. Both calibration and geometric issues have been taken into account

  16. An optimised set-up for total reflection particle induced X-ray emission

    International Nuclear Information System (INIS)

    Kan, J.A. van; Vis, R.D.

    1997-01-01

    MeV proton beams at small angles of incidence (0-35 mrad) are used to analyse trace elements on flat surfaces such as Si wafers or quartz substrates. In these experiments, the particle induced X-ray emission (PIXE) signal is used in a new optimized set-up. This set-up is constructed in such a way that the X-ray detector can reach very large solid angles, larger than 1 sr. Use of these large detector solid angles, combined with the reduction of bremsstrahlung background, affords limits of detection (LOD) of the order of 10 10 at cm -2 using total reflection particle induced X-ray emission (TPIXE). The LODs from earlier TPIXE measurements in a non-optimized set-up are used to estimate LODs in the new TPIXE set-up. Si wafers with low surface concentrations of V, Ni, Cu and Ag are used as standards to calibrate the LODs found with this set-up. The metal concentrations are determined by total reflection X-ray fluorescence (TXRF). The TPIXE measurements are compared with TXRF measurements on the same wafers. (Author)

  17. Abstracts of the 8th Conference on total reflection x-ray fluorescence analysis and related methods

    International Nuclear Information System (INIS)

    Wobrauschek, P.

    2000-01-01

    The 8. conference on total reflection x-ray fluorescence analysis and related methods held from 25.9 to 29.9.2000 contains 79 abstracts about x-ray fluorescence analysis (XRFA) as a powerful tool used for industrial production, geological prospecting and for environmental control. Total reflection x-ray fluorescence spectroscopy is also a tool used for chemical analysis in medicine, industry and research. (E.B.)

  18. Total reflection x-ray fluorescence - an approach to nanoanalysis

    International Nuclear Information System (INIS)

    Klockenkaemper, R.

    2000-01-01

    X-ray fluorescence analysis (XRFA) is a powerful tool used for industrial production, geological prospecting and for environmental control. However, the method suffers from a lack of sensitivity so that analyses are restricted to microanalytical investigations. That means: the sample amount needed for analysis is above some 10 micrograms, concentrations to be determined have to be on the μg/ml level, and thin layers to be characterized must be of micrometer thickness. In contrast to conventional XRFA, total-reflection X-ray fluorescence (TXRF) is extremely sensitive and even allows nano-analytical investigations. Three different ways can be taken: (i) use of minute sample amounts of only 10 nano-grams, (ii) determination of extreme traces below ng/ml and (iii) surface analysis and depth profiling of shallow layers with nano-meter thickness. In this lecture, the basic physical phenomena of total reflection and standing waves are outlined. The experimental equipment for TXRF is sketched out and commercially available instruments of different manufacturers are compared. Furthermore, examples are given for the three kinds of nano-analytical applications: ultra-micro, analysis, ultra trace analysis and mono- and thin-layer analysis. (author)

  19. Confocal total reflection X-ray fluorescence technology based on an elliptical monocapillary and a parallel polycapillary X-ray optics.

    Science.gov (United States)

    Zhu, Yu; Wang, Yabing; Sun, Tianxi; Sun, Xuepeng; Zhang, Xiaoyun; Liu, Zhiguo; Li, Yufei; Zhang, Fengshou

    2018-07-01

    A total reflection X-ray fluorescence (TXRF) spectrometer based on an elliptical monocapillary X-ray lens (MXRL) and a parallel polycapillary X-ray lens (PPXRL) was designed. This TXRF instrument has micro focal spot, low divergence and high intensity of incident X-ray beam. The diameter of the focal spot of MXRL was 16.5 µm, and the divergence of the incident X-ray beam was 3.4 mrad. We applied this TXRF instrument to the micro analysis of a single-layer film containing Ni deposited on a Si substrate by metal vapor vacuum arc ion source. Copyright © 2018 Elsevier Ltd. All rights reserved.

  20. Full Polarization Analysis of Resonant Superlattice and Forbidden x-ray Reflections in Magnetite

    International Nuclear Information System (INIS)

    Wilkins, S.B.; Bland, S.R.; Detlefs, B.; Beale, T.A.W.; Mazzoli, C.; Joly, Y.; Hatton, P.D.; Lorenzo, J.E.; Brabers, V.A.M.

    2009-01-01

    Despite being one of the oldest known magnetic materials, and the classic mixed valence compound, thought to be charge ordered, the structure of magnetite below the Verwey transition is complex and the presence and role of charge order is still being debated. Here, we present resonant x-ray diffraction data at the iron K-edge on forbidden (0, 0, 2n+1) C and superlattice (0, 0, 2n+1/2)C reflections. Full linear polarization analysis of the incident and scattered light was conducted in order to explore the origins of the reflections. Through simulation of the resonant spectra we have confirmed that a degree of charge ordering takes place, while the anisotropic tensor of susceptibility scattering is responsible for the superlattice reflections below the Verwey transition. We also report the surprising result of the conversion of a significant proportion of the scattered light from linear to nonlinear polarization.

  1. Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity

    International Nuclear Information System (INIS)

    Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Devishvili, A; Toperverg, B P; Zabel, H; Theis-Bröhl, K; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C

    2012-01-01

    We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole–dipole interaction is rather strong, dominating the collective magnetic properties at room temperature. (paper)

  2. Self-assembled iron oxide nanoparticle multilayer: x-ray and polarized neutron reflectivity.

    Science.gov (United States)

    Mishra, D; Benitez, M J; Petracic, O; Badini Confalonieri, G A; Szary, P; Brüssing, F; Theis-Bröhl, K; Devishvili, A; Vorobiev, A; Konovalov, O; Paulus, M; Sternemann, C; Toperverg, B P; Zabel, H

    2012-02-10

    We have investigated the structure and magnetism of self-assembled, 20 nm diameter iron oxide nanoparticles covered by an oleic acid shell for scrutinizing their structural and magnetic correlations. The nanoparticles were spin-coated on an Si substrate as a single monolayer and as a stack of 5 ML forming a multilayer. X-ray scattering (reflectivity and grazing incidence small-angle scattering) confirms high in-plane hexagonal correlation and a good layering property of the nanoparticles. Using polarized neutron reflectivity we have also determined the long range magnetic correlations parallel and perpendicular to the layers in addition to the structural ones. In a field of 5 kOe we determine a magnetization value of about 80% of the saturation value. At remanence the global magnetization is close to zero. However, polarized neutron reflectivity reveals the existence of regions in which magnetic moments of nanoparticles are well aligned, while losing order over longer distances. These findings confirm that in the nanoparticle assembly the magnetic dipole-dipole interaction is rather strong, dominating the collective magnetic properties at room temperature.

  3. Direct analysis of biological samples by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Lue M, Marco P.; Hernandez-Caraballo, Edwin A.

    2004-01-01

    The technique of total reflection X-ray fluorescence (TXRF) is well suited for the direct analysis of biological samples due to the low matrix interferences and simultaneous multi-element nature. Nevertheless, biological organic samples are frequently analysed after digestion procedures. The direct determination of analytes requires shorter analysis time, low reactive consumption and simplifies the whole analysis process. On the other hand, the biological/clinical samples are often available in minimal amounts and routine studies require the analysis of large number of samples. To overcome the difficulties associated with the analysis of organic samples, particularly of solid ones, different procedures of sample preparation and calibration to approach the direct analysis have been evaluated: (1) slurry sampling, (2) Compton peak standardization, (3) in situ microwave digestion, (4) in situ chemical modification and (5) direct analysis with internal standardization. Examples of analytical methods developed by our research group are discussed. Some of them have not been previously published, illustrating alternative strategies for coping with various problems that may be encountered in the direct analysis by total reflection X-ray fluorescence spectrometry

  4. First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

    Energy Technology Data Exchange (ETDEWEB)

    Cibin, G. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxon OX110DE (United Kingdom); IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy); Universita' degli Studi di Roma Tre, Dipartimento di Scienze Geologiche, L.go S. Leonardo Murialdo 1, 00146 Roma (Italy)], E-mail: giannantonio.cibin@diamond.ac.uk; Marcelli, A. [INFN - Laboratori Nazionali di Frascati, P.O. Box 13, 00044 Frascati (Roma) (Italy); Maggi, V. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Sala, M. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Milano, Dipartimento di Scienze della Terra ' A. Desio' , Sez. Mineralogia, Via Mangiagalli 34, 20133 Milano (Italy); Marino, F.; Delmonte, B. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Albani, S. [Universita degli Studi di Milano-Bicocca, Dipartimento di Scienze dell' Ambiente e del Territorio, Piazza della Scienza 1, 20126 Milano (Italy); Universita degli Studi di Siena, Dottorato in Scienze Polari, via Laterina 8, 53100 Siena (Italy); Pignotti, S. [IMONT/EIM, Ente Italiano della Montagna, P.za dei Caprettari 70, 00176 Roma (Italy)

    2008-12-15

    Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 {mu}g range.

  5. First combined total reflection X-ray fluorescence and grazing incidence X-ray absorption spectroscopy characterization of aeolian dust archived in Antarctica and Alpine deep ice cores

    International Nuclear Information System (INIS)

    Cibin, G.; Marcelli, A.; Maggi, V.; Sala, M.; Marino, F.; Delmonte, B.; Albani, S.; Pignotti, S.

    2008-01-01

    Aeolian mineral dust archived in polar and mid latitude ice cores represents a precious proxy for assessing environmental and climatic variations at different timescales. In this respect, the identification of dust mineralogy plays a key role. In this work we performed the first preliminary X-ray absorption spectroscopy (XAS) experiments on mineral dust particles extracted from Antarctic and from Alpine firn cores using grazing incidence geometry at the Fe K-edge. A dedicated high vacuum experimental chamber was set up for normal-incidence and total-reflection X-Ray Fluorescence and Absorption Spectroscopy analyses on minor amounts of mineral materials at the Stanford Synchrotron Radiation Laboratory. Results show that this experimental technique and protocol allows recognizing iron inclusion mineral fraction on insoluble dust in the 1-10 μg range

  6. Microanalysis of old violin varnishes by total-reflection X-ray fluorescence

    Science.gov (United States)

    von Bohlen, Alex; Meyer, Friedrich

    1997-07-01

    Total reflection X-ray fluorescence was used to characterize elements (with Z>13) contained in varnishes applied by prominent violin makers during the last five centuries. Direct analyses of small flakes with masses varnish. Higher amounts of Fe, As and Pb were found in old products, Mn, Co, Cu, Zn and Pb were used in more recent varnishes.

  7. Comparison of conventional and total reflection excitation geometry for fluorescence X-ray absorption spectroscopy on droplet samples

    International Nuclear Information System (INIS)

    Falkenberg, G.; Pepponi, G.; Streli, C.; Wobrauschek, P.

    2003-01-01

    X-ray absorption fine structure (XAFS) experiments in fluorescence mode have been performed in total reflection excitation geometry and conventional 45 deg. /45 deg. excitation/detection geometry for comparison. The experimental results have shown that XAFS measurements are feasible under normal total reflection X-ray fluorescence (TXRF) conditions, i.e. on droplet samples, with excitation in grazing incidence and using a TXRF experimental chamber. The application of the total reflection excitation geometry for XAFS measurements increases the sensitivity compared to the conventional geometry leading to lower accessible concentration ranges. However, XAFS under total reflection excitation condition fails for highly concentrated samples because of the self-absorption effect

  8. Development of off-line layer chromatographic and total reflection X-ray fluorescence spectrometric methods for arsenic speciation

    International Nuclear Information System (INIS)

    Mihucz, Victor G.; Moricz, Agnes M.; Kroepfl, Krisztina; Szikora, Szilvia; Tatar, Eniko; Parra, Lue Meru Marco; Zaray, Gyula

    2006-01-01

    Rapid and low cost off-line thin layer chromatography-total reflection X-ray fluorescence spectrometry and overpressured thin layer chromatography-total reflection X-ray fluorescence spectrometry methods have been developed for separation of 25 ng of each As(III), As(V), monomethyl arsonic acid and dimethylarsinic acid applying a PEI cellulose stationary phase on plastic sheets and a mixture of acetone/acetic acid/water = 2:1:1 (v/v/v) as eluent system. The type of eluent systems, the amounts (25-1000 ng) of As species applied to PEI cellulose plates, injection volume, development distance, and flow rate (in case of overpressured thin layer chromatography) were taken into consideration for the development of the chromatographic separation. Moreover, a microdigestion method employing nitric acid for the As spots containing PEI cellulose scratched from the developed plates divided into segments was developed for the subsequent total reflection X-ray fluorescence spectrometry analysis. The method was applied for analysis of root extracts of cucumber plants grown in As(III) containing modified Hoagland nutrient solution. Both As(III) and As(V) were detected by applying the proposed thin layer chromatography/overpressured thin layer chromatography-total reflection X-ray fluorescence spectrometry methods

  9. Development of off-line layer chromatographic and total reflection X-ray fluorescence spectrometric methods for arsenic speciation

    Energy Technology Data Exchange (ETDEWEB)

    Mihucz, Victor G. [Joint Research Group of Environmental Chemistry of Hungarian Academy of Sciences and L. Eoetvoes University, P. O. Box 32, H-1518 Budapest (Hungary); Hungarian Satellite Centre of Trace Elements Institute to UNESCO, P. O. Box 32, H-1518 Budapest (Hungary); Moricz, Agnes M. [L. Eoetvoes University, Department of Chemical Technology and Environmental Chemistry, P.O. Box 32, H-1518 Budapest (Hungary); Kroepfl, Krisztina [Joint Research Group of Environmental Chemistry of Hungarian Academy of Sciences and L. Eoetvoes University, P. O. Box 32, H-1518 Budapest (Hungary); Szikora, Szilvia [Joint Research Group of Environmental Chemistry of Hungarian Academy of Sciences and L. Eoetvoes University, P. O. Box 32, H-1518 Budapest (Hungary); Tatar, Eniko [Hungarian Satellite Centre of Trace Elements Institute to UNESCO, P. O. Box 32, H-1518 Budapest (Hungary); L. Eoetvoes University, Department of Inorganic and Analytical Chemistry, P.O. Box 32, H-1518 Budapest (Hungary); Parra, Lue Meru Marco [Universidad Centro-occidental Lisandro Alvarado, Decanato de Agronomia, Departamento de Quimica y Suelos Unidad de Analisis Instrumental, Apartado Postal 4076, Cabudare 3023 (Venezuela); Zaray, Gyula [Joint Research Group of Environmental Chemistry of Hungarian Academy of Sciences and L. Eoetvoes University, P. O. Box 32, H-1518 Budapest (Hungary) and Hungarian Satellite Centre of Trace Elements Institute to UNESCO, P. O. Box 32, H-1518 Budapest (Hungary) and L. Eoetvoes University, Department of Inorganic and Analytical Chemistry, P.O. Box 32, H-1518 Budapest (Hungary)]. E-mail: zaray@ludens.elte.hu

    2006-11-15

    Rapid and low cost off-line thin layer chromatography-total reflection X-ray fluorescence spectrometry and overpressured thin layer chromatography-total reflection X-ray fluorescence spectrometry methods have been developed for separation of 25 ng of each As(III), As(V), monomethyl arsonic acid and dimethylarsinic acid applying a PEI cellulose stationary phase on plastic sheets and a mixture of acetone/acetic acid/water = 2:1:1 (v/v/v) as eluent system. The type of eluent systems, the amounts (25-1000 ng) of As species applied to PEI cellulose plates, injection volume, development distance, and flow rate (in case of overpressured thin layer chromatography) were taken into consideration for the development of the chromatographic separation. Moreover, a microdigestion method employing nitric acid for the As spots containing PEI cellulose scratched from the developed plates divided into segments was developed for the subsequent total reflection X-ray fluorescence spectrometry analysis. The method was applied for analysis of root extracts of cucumber plants grown in As(III) containing modified Hoagland nutrient solution. Both As(III) and As(V) were detected by applying the proposed thin layer chromatography/overpressured thin layer chromatography-total reflection X-ray fluorescence spectrometry methods.

  10. Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

    Energy Technology Data Exchange (ETDEWEB)

    Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)]. E-mail: streli@ati.ac.at; Pepponi, G. [ITC-irst, Povo (Italy); Wobrauschek, P. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Jokubonis, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Falkenberg, G. [Hamburger Synchrotronstrahlungslabor at Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22603 Hamburg (Germany); Zaray, G. [Institute of Inorganic and Applied Chemistry, 3 EOTVOS Univ, Budapest (Hungary); Broekaert, J. [Institute of Anorganic and Applied Chemistry, University Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Fittschen, U. [Institute of Anorganic and Applied Chemistry, University Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Peschel, B. [Institute of Anorganic and Applied Chemistry, University Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany)

    2006-11-15

    At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm{sup 2} active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm{sup 2} silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni. Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al{sub 2}O{sub 3}. No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are

  11. Recent results of synchrotron radiation induced total reflection X-ray fluorescence analysis at HASYLAB, beamline L

    International Nuclear Information System (INIS)

    Streli, C.; Pepponi, G.; Wobrauschek, P.; Jokubonis, C.; Falkenberg, G.; Zaray, G.; Broekaert, J.; Fittschen, U.; Peschel, B.

    2006-01-01

    At the Hamburger Synchrotronstrahlungslabor (HASYLAB), Beamline L, a vacuum chamber for synchrotron radiation-induced total reflection X-ray fluorescence analysis, is now available which can easily be installed using the adjustment components for microanalysis present at this beamline. The detector is now in the final version of a Vortex silicon drift detector with 50-mm 2 active area from Radiant Detector Technologies. With the Ni/C multilayer monochromator set to 17 keV extrapolated detection limits of 8 fg were obtained using the 50-mm 2 silicon drift detector with 1000 s live time on a sample containing 100 pg of Ni. Various applications are presented, especially of samples which are available in very small amounts: As synchrotron radiation-induced total reflection X-ray fluorescence analysis is much more sensitive than tube-excited total reflection X-ray fluorescence analysis, the sampling time of aerosol samples can be diminished, resulting in a more precise time resolution of atmospheric events. Aerosols, directly sampled on Si reflectors in an impactor were investigated. A further application was the determination of contamination elements in a slurry of high-purity Al 2 O 3 . No digestion is required; the sample is pipetted and dried before analysis. A comparison with laboratory total reflection X-ray fluorescence analysis showed the higher sensitivity of synchrotron radiation-induced total reflection X-ray fluorescence analysis, more contamination elements could be detected. Using the Si-111 crystal monochromator also available at beamline L, XANES measurements to determine the chemical state were performed. This is only possible with lower sensitivity as the flux transmitted by the crystal monochromator is about a factor of 100 lower than that transmitted by the multilayer monochromator. Preliminary results of X-ray absorption near-edge structure measurements for As in xylem sap from cucumber plants fed with As(III) and As(V) are reported. Detection

  12. Sources of linear polarized x-rays

    International Nuclear Information System (INIS)

    Aiginger, H.; Wobrauschek, P.

    1989-01-01

    Linear polarized X-rays are used in X-ray fluorescence analysis to decrease the background caused by scattered photons. Various experiments, calculations and constructions have demonstrated the possibility to produce polarized radiation in an analytical laboratory with an X-ray tube and polarizer-analyzer facilities as auxiliary equipment. The results obtained with Bragg-polarizers of flat and curved focussing geometry and of Barkla-polarizers are presented. The advantages and disadvantages of the method are discussed and compared with the respective quality of synchrotron radiation. Polarization by scattering reduces the intensity of the primary radiation. Recently much effort is devoted to the construction of integrated high power X-ray tube polarizer-analyzer arrangements. The detailed design, geometry and performance of such a facility is described. (author)

  13. The effect of surface texture on total reflection of neutrons and X-rays from modified interfaces

    DEFF Research Database (Denmark)

    Goldar, A.; Roser, S.J.; Hughes, A.

    2002-01-01

    X-ray and neutron scattering from macroscopically rough surfaces and interfaces is considered and a new method of analysis based on the variation of the shape of the total reflection edge in the reflectivity profile is proposed. It was shown that in the limit that the correlation length and the h......X-ray and neutron scattering from macroscopically rough surfaces and interfaces is considered and a new method of analysis based on the variation of the shape of the total reflection edge in the reflectivity profile is proposed. It was shown that in the limit that the correlation length...... and the height of the surface roughness are larger than the wavelength (at least 100 times bigger) of the incoming beam, the total reflection edge in the reflection profile becomes rounded. This technique allows direct analysis of the variation of the reflectivity pro le in terms of the structure of the surface...

  14. The polarized neutron reflectivity and X-ray reflectivity studies of the magnetic profiles of epitaxial Ni80Fe20/Ru multilayers

    International Nuclear Information System (INIS)

    Su, H.-C.; Peir, J.-J.; Lee, C.-H.; Lin, M.-Z.; Wu, P.-T.; Huang, J.C.A.; Tun Zin

    2005-01-01

    The depth profiles of the epitaxial Ni 80 Fe 20 (1 1 1)/Ru(0 0 0 1) multilayers were studied by polarized neutron reflectivity and X-ray reflectivity. At the Ru thickness that the anti-ferromagnetic coupling was found, the magnetic moments between two Ni 80 Fe 20 interlayers show a biquadratic coupling effect with a double unit cell at low applied fields. A magnetic dead layer of about 0.3 nm was also found at the interface boundaries. The maximal polarization effect applied to the Ru layer is less than 0.03μ B

  15. Backscatter, anisotropy, and polarization of solar hard X-rays

    International Nuclear Information System (INIS)

    Bai, T.; Ramaty, R.

    1978-01-01

    Hard X-rays incident upon the photosphere with energies > or approx. =15 keV have high probabilities of backscatter due to Compton collisions with electrons. This effect has a strong influence on the spectrum, intensity, and polarization of solar hard X-rays - especially for anisotropic models in which the primary X-rays are emitted predominantly toward the photosphere. We have carried out a detailed study of X-ray backscatter, and we have investigated the interrelated problems of anisotropy, polarization, center-to-limb variation of the X-ray spectrum, and Compton backscatter in a coherent fashion. The results of this study are compared with observational data. Because of the large contribution from backscatter, for an anisotropic primary X-ray source which is due to bremsstrahlung of accelerated electrons moving predominantly down toward the photosphere, the observed X-ray flux around 30 keV does not depend significantly on the position of flare on the Sun. For such an anisotropic source, the X-ray spectrum observed in the 15-50 keV range becomes steeper with the increasing heliocentric angle of the flare. These results are compatible with the data. The degree of polarization of the sum of the primary and reflected X-rays with energies between about 15 and 30 keV can be very large for anisotropic primary X-ray sources, but it is less than about 4% for isotropic sources. We also discuss the characteristics of the brightness distribution of the X-ray albedo patch created by the Compton backscatter. The height and anisotropy of the primary hard X-ray source might be inferred from the study of the albedo patch

  16. Application of the Total Reflection X-ray Fluorescence technique to trace elements determination in tobacco

    International Nuclear Information System (INIS)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2008-01-01

    Many studies have identified an important number of toxic elements along with organic carcinogen molecules and radioactive isotopes in tobacco. In this work we have analyzed by Total Reflection X-Ray Fluorescence 9 brands of cigarettes being manufactured and distributed in the Mexican market. Two National Institute of Standards and Technology standards and a blank were equally treated at the same time. Results show the presence of some toxic elements such as Pb and Ni. These results are compared with available data for some foreign brands, while their implications for health are discussed. It can be confirmed that the Total Reflection X-Ray Fluorescence method provides precise (reproducible) and accuracy (trueness) data for 15 elements concentration in tobacco samples

  17. Application of the Total Reflection X-ray Fluorescence technique to trace elements determination in tobacco

    Science.gov (United States)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2008-12-01

    Many studies have identified an important number of toxic elements along with organic carcinogen molecules and radioactive isotopes in tobacco. In this work we have analyzed by Total Reflection X-Ray Fluorescence 9 brands of cigarettes being manufactured and distributed in the Mexican market. Two National Institute of Standards and Technology standards and a blank were equally treated at the same time. Results show the presence of some toxic elements such as Pb and Ni. These results are compared with available data for some foreign brands, while their implications for health are discussed. It can be confirmed that the Total Reflection X-Ray Fluorescence method provides precise (reproducible) and accuracy (trueness) data for 15 elements concentration in tobacco samples.

  18. Applications of total reflection X-ray fluorescence in multi-element analysis

    International Nuclear Information System (INIS)

    Michaelis, W.; Prange, A.; Knoth, J.

    1985-01-01

    Although Total Reflection X-Ray Fluorescence Analysis (TXRF) became available for practical applications and routine measurements only few years ago, the number of programmes that make use of this method is increasing rapidly. The scope of work is widespread over environmental research and monitoring, mineralogy, mineral exploration, oceanography, biology, medicine and biochemistry. The present paper gives a brief survey of these applications and summarizes some of them which are typical for quite different matrices. (orig.)

  19. TX 2000: total reflection and 45o energy dispersive x-ray fluorescence spectrometer

    International Nuclear Information System (INIS)

    Pasti, F.; Torboli, A.; Valdes, M.

    2000-01-01

    This equipment, developed by Ital Structures, combines two kinds of energy dispersive X-ray fluorescence techniques, the first using total reflection geometry and the second conventional 45 o geometry. The equipment is completely controlled by a PC and to reach the condition of total reflection is very easy because it is enough to load the file with the right position for the corresponding energy. In this apparatus we used an x-ray tube with an alloy anode of Mo/W with a long fine focus at 2200 W. To monochromatize the x-ray beam while choosing, for example, the Mo K alpha or W L alpha or a piece of white spectrum of 33 keV, we use a highly reflective multilayer made of Si/W with 2d = 45.5 A o . The detector used in the equipment is a lithium drifted silicon detector (Si(Li)) with an excellent energy resolution of 135 eV at 5.9 keV and 1000 cps. We developed two programs written in Windows 95, 98 and NT for a 32 bit microprocessor. The first one is called TYACQ32 and has the following functions: first, complete control of the hardware, second automatic alignment of the TX 2000 spectrometer and third acquisition of spectra. The second program is EDXRF32. This is a program to accomplish spectrum and quantitative analysis for TXRF and EDXRF 45 o degrees analysis. (author)

  20. Determination of technetium by total reflection x-ray fluorescence

    International Nuclear Information System (INIS)

    Bermudez, J.I.; Greaves, E.D.; Nemeth, P.

    2000-01-01

    We describe a technique using total reflection x-ray fluorescence (TXRF) for determination of Technetium produced by elution of chromatography generators with physiological saline solutions. The analysis with the 18.41 keV K α line of Technetium was accomplished with monochromatized K α radiation from a silver anode x-ray tube operated at 45 keV and 20 mA. This radiation at 22.104 keV is efficiently coupled to the 21.054 keV absorption edge of Tc. It is also of advantage in the direct analysis of organic and saline properties of the Tc-bearing samples. Quantification was accomplished by internal standard addition of Ga and using an interpolated value of the sensitivity for Tc between Molybdenum and Rhenium. Data processing was carried out with the QXAS-AXIL software package. System sensitivity was found adequate for direct Tc determination of eluted saline solutions. The interest and advantages of the use of the technique as an auxiliary in the synthesis and characterization of Tc-labeled radiopharmaceuticals used for diagnosis in nuclear medicine are discussed. Detection limits in the matrices analyzed are reported. (author)

  1. Polarized X-ray excitation for scatter reduction in X-ray fluorescence computed tomography.

    Science.gov (United States)

    Vernekohl, Don; Tzoumas, Stratis; Zhao, Wei; Xing, Lei

    2018-05-25

    X-ray fluorescence computer tomography (XFCT) is a new molecular imaging modality which uses X-ray excitation to stimulate the emission of fluorescent photons in high atomic number contrast agents. Scatter contamination is one of the main challenges in XFCT imaging which limits the molecular sensitivity. When polarized X-rays are used, it is possible to reduce the scatter contamination significantly by placing detectors perpendicular to the polarization direction. This study quantifies scatter contamination for polarized and unpolarized X-ray excitation and determines the advantages of scatter reduction. The amount of scatter in preclinical XFCT is quantified in Monte Carlo simulations. The fluorescent X-rays are emitted isotropically, while scattered X-rays propagate in polarization direction. The magnitude of scatter contamination is studied in XFCT simulations of a mouse phantom. In this study, the contrast agent gold is examined as an example but a scatter reduction from polarized excitation is also expected for other elements. The scatter reduction capability is examined for different polarization intensities with a monoenergetic X-ray excitation energy of 82 keV. The study evaluates two different geometrical shapes of CZT detectors which are modeled with an energy resolution of 1 keV FWHM at an X-ray energy of 80 keV. Benefits of a detector placement perpendicular to the polarization direction are shown in iterative and analytic image reconstruction including scatter correction. The contrast to noise ratio (CNR) and the normalized mean square error (NMSE) are analyzed and compared for the reconstructed images. A substantial scatter reduction for common detector sizes was achieved for 100% and 80% linear polarization while lower polarization intensities provide a decreased scatter reduction. By placing the detector perpendicular to the polarization direction, a scatter reduction by factor up to 5.5 can be achieved for common detector sizes. The image

  2. Total Reflection X-ray Fluorescence Analysis (TXRF) using the high flux SAXS camera

    CERN Document Server

    Wobrauschek, P; Pepponi, G; Bergmann, A; Glatter, O

    2002-01-01

    Combining the high photon flux from a rotating anode X-ray tube with an X-ray optical component to focus and monochromatize the X-ray beam is the most promising instrumentation for best detection limits in the modern XRF laboratory. This is realized by using the design of a high flux SAXS camera in combination with a 4 kW high brilliant rotating Cu anode X-ray tube with a graded elliptically bent multilayer and including a new designed module for excitation in total reflection geometry within the beam path. The system can be evacuated thus reducing absorption and scattering of air and removing the argon peak in the spectra. Another novelty is the use of a Peltier cooled drift detector with an energy resolution of 148 eV at 5.9 keV and 5 mm sup 2 area. For Co detection limits of about 300 fg determined by a single element standard have been achieved. Testing a real sample NIST 1643d led to detection limits in the range of 300 ng/l for the medium Z.

  3. Probing the Accretion Geometry of Black Holes with X-Ray Polarization

    Science.gov (United States)

    Schnitman, Jeremy D.

    2011-01-01

    In the coming years, new space missions will be able to measure X-ray polarization at levels of 1% or better in the approx.1-10 keV energy band. In particular, X-ray polarization is an ideal tool for determining the nature of black hole (BH) accretion disks surrounded by hot coronae. Using a Monte Carlo radiation transport code in full general relativity, we calculate the spectra and polarization features of these BH systems. At low energies, the signal is dominated by the thermal flux coming directly from the optically thick disk. At higher energies, the thermal seed photons have been inverse-Compton scattered by the corona, often reflecting back off the disk before reaching the observer, giving a distinctive polarization signature. By measuring the degree and angle of this X-ray polarization, we can infer the BH inclination, the emission geometry of the accretion flow, and also determine the spin of the black hole.

  4. High reflectance Cr/C multilayer at 250 eV for soft X-ray polarimetry

    Energy Technology Data Exchange (ETDEWEB)

    Wen, Mingwu; Jiang, Li; Zhang, Zhong; Huang, Qiushi [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); Wang, Zhanshan, E-mail: wangzs@tongji.edu.cn [MOE Key Laboratory of Advanced Micro-Structured Materials, Institute of Precision Optical Engineering (IPOE), School of Physics Science and Engineering, Tongji University, Shanghai 200092 (China); She, Rui; Feng, Hua [Department of Engineering Physics, Tsinghua University, Beijing (China); Wang, Hongchang [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE (United Kingdom)

    2015-10-01

    X-ray reflection near 45° via multilayer mirrors can be used for astronomical polarization measurements. A Cr/C multilayer mirror (designed for X-ray polarimetry at 250 eV), with a period thickness of 3.86 nm and a bi-layer number of 100, was fabricated using direct current magnetron sputtering. Grazing incidence X-ray reflectometry at 8 keV and transmission electron microscopy were used to investigate the multilayer structure. Different models were introduced to fit the hard X-ray reflectivity curve, which indicates that the layer thickness of two materials slightly drifts from the bottom to the top of the stack. Both the chromium and carbon layers are amorphous with asymmetric interfaces, while the Cr-on-C interface is slightly wider. Based on the good quality of the multilayer structure, a high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV at a grazing incidence angle of 40.7°. The fabricated Cr/C multilayer mirror exhibits high reflectivity and polarization levels in the energy region of 240 eV–260 eV. - Highlights: • We fabricated Cr/C multilayer with 3.8 nm d-spacing. • X-ray reflectometry was used to determine the exact structure of Cr/C multilayer. • A high reflectivity of 21.8% for the s-polarized light was obtained at 250 eV. • Both Cr and C were found to be amorphous with slightly asymmetric interfaces. • A 4-layer model was used to fit and explain the results.

  5. On the polarization mixing of X-rays

    International Nuclear Information System (INIS)

    Ohkawa, T.; Hashimoto, H.

    1984-01-01

    Relativistic quantum field theory is applied to discuss the process of interference of white X-rays and the mechanism of rotation of the polarization of X-rays in crystals. A two-photon state is studied theoretically for analyzing the mechanism of the polarization mixing. Diffracted X-ray photons are produced by two successive stages of interaction between incident X-rays and electrons in a crystal. A dispersion relation of diffracted X-rays similar to Laue's dynamic theory is shown by use of the S-matrix. A dynamical structure factor is defined on the base of Dirac's γ-matrix. (author)

  6. Total reflection X-ray fluorescence with synchrotron radiation applied to biological and environmental samples

    International Nuclear Information System (INIS)

    Simabuco, S.M.; Matsumoto, E.; Jesus, E.F.O.; Lopes, R.T.; Perez, C.; Nascimento Filho, V.F.; Costa, R.S.S.; Tavares do Carmo, M.G.; Saunders, C.

    2001-01-01

    Full text: The Total Reflection X-ray Fluorescence has been applied for trace elements in water and aqueous solutions, environmental samples and biological materials after sample preparation and to surface analysis of silicon wafers. The present paper shows some results of applications for rainwater, atmospheric particulate material, colostrum and nuclear samples. (author)

  7. Polarization and long-term variability of Sgr A* X-ray echo

    Science.gov (United States)

    Churazov, E.; Khabibullin, I.; Ponti, G.; Sunyaev, R.

    2017-06-01

    We use a model of the molecular gas distribution within ˜100 pc from the centre of the Milky Way (Kruijssen, Dale & Longmore) to simulate time evolution and polarization properties of the reflected X-ray emission, associated with the past outbursts from Sgr A*. While this model is too simple to describe the complexity of the true gas distribution, it illustrates the importance and power of long-term observations of the reflected emission. We show that the variable part of X-ray emission observed by Chandra and XMM-Newton from prominent molecular clouds is well described by a pure reflection model, providing strong support of the reflection scenario. While the identification of Sgr A* as a primary source for this reflected emission is already a very appealing hypothesis, a decisive test of this model can be provided by future X-ray polarimetric observations, which will allow placing constraints on the location of the primary source. In addition, X-ray polarimeters (like, e.g. XIPE) have sufficient sensitivity to constrain the line-of-sight positions of molecular complexes, removing major uncertainty in the model.

  8. Beer analysis by synchrotron radiation total reflection X-ray fluorescence (SR-TXRF)

    International Nuclear Information System (INIS)

    Moreira, Silvana; Vives, Ana Elisa S. de; Nascimento Filho, Virgilio F.; Zucchi, Orgheda L.D.A.

    2005-01-01

    In this work the concentrations of P, S, Cl, K, Ca, Mn, Fe, Zn and Br in twenty-nine brands of national and international beers were determined by Synchrotron Radiation Total Reflection X-Ray Fluorescence analysis (SR-TXRF). The results were compared with the limits established by the Brazilian Legislation and the nutritive values established by National Agricultural Library (NAL). The measurements were performed at the X-ray Fluorescence Beamline at Synchrotron Light Source Laboratory, in Campinas, Sao Paulo, Brazil, using a polychromatic beam for excitation. A small volume of 5 μL of sample beers containing just an internal standard, used to correct geometry effects, were analyzed without any pre-treatment. The measuring time was 100 s and the detection limits obtained varied from 1μg.L -1 for Mn and Fe to 15μg.L -1 for P. (author)

  9. Total reflection X-ray fluorescence and archaeometry: Application in the Argentinean cultural heritage

    Energy Technology Data Exchange (ETDEWEB)

    Vazquez, Cristina [Comision Nacional de Energia Atomica, Av. Gral Paz 1499 (B1650KNA) San Martin, Buenos Aires (Argentina); Laboratorio de Quimica de Sistemas Heterogeneos, Facultad de Ingenieria, Universidad de Buenos Aires, P. Colon 850 (C1063ACU), Buenos Aires (Argentina)], E-mail: Cristina.Vazquez@cnea.gov.ar; Albornoz, Ana [Agencia Rio Negro Cultura, Museo de la Patagonia F.P.Moreno, Centro Civico s/n Bariloche, Rio Negro (Argentina); Hajduk, Adam [CONICET, Museo de la Patagonia F.P.Moreno, Centro Civico s/n Bariloche, Rio Negro (Argentina); Elkin, Dolores [CONICET Instituto Nacional de Antropologia y Pensamiento Latinoamericano, 3 de febrero 1378 (C1426AEL) Buenos Aires (Argentina); Custo, Graciela; Obrustky, Alba [Comision Nacional de Energia Atomica, Av. Gral Paz 1499 (B1650KNA) San Martin, Buenos Aires (Argentina)

    2008-12-15

    Archaeometry is an interdisciplinary research area involved in the development and use of scientific methods in order to answer questions concerned with the human history. In this way the knowledge of archaeological objects through advanced chemical and physical analyses permits a better preservation and conservation of the cultural heritage and also reveals materials and technologies used in the past. In this sense, analytical techniques play an important role in order to provide chemical information about cultural objects. Considering the non destructive characteristic of this study, analytical techniques must be adequate in order to prevent any alteration or damage and in addition to allow the conservation of their integrity. Taking into account the irreplaceable character of the archaeological and artistic materials considered in this study, analytical techniques must be adequate in order to prevent any alteration or damage and in addition to allow the conservation of their integrity. Total Reflection X-ray Fluorescence Spectrometry as a geometric variant of conventional X-ray fluorescence is a proved microanalytical technique considering the small amount of sample required for the analysis. A few micrograms are enough in order to reveal valuable information about elemental composition and in this context it is highly recommended for artwork studies. In this paper a case study is presented in which Total Reflection X-Ray Fluorescence Spectrometry has been successfully employed in the archaeometry field. Examples from Argentinean cultural heritage sites related with the determination of pigments in paintings on canvas and in rock sites as well as in underwater archaeology research are shown.

  10. Chlorine determination in (U, Pu)C fuel by total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Misra, Nand Lal; Dhara, Sangita; Mudher, Khush Dev Singh; Aggarwal, Suresh K.; Thakur, Uday Kumar; Shah, Dipti; Sawant, R.M.; Ramakumar, K.L.

    2007-01-01

    A Total Reflection X-ray Fluorescence (TXRF) method for the determination of chlorine in (U,Pu)C has been developed. The method involves calibration of the instrument with standard solutions and validation of TXRF determination of chlorine using synthetic standard solutions. Cl K α line excited with W L α source was used for TXRF determinations of chlorine. Chlorine present in trace amounts in (U,Pu)C samples was first separated by pyro hydrolysis. The evolved chlorine, in form of HCl, was collected in 5 mM NaOH solution. This solution was analyzed for chlorine by Total Reflection X-ray Fluorescence Spectrometry using cobalt as an internal standard. The TXRF detection limit of chlorine was found to be 3.6 pg with sample size of 30 μL. In order to assess the applicability of TXRF method for chlorine determinations in other nuclear materials, one U 3 O 8 trace element standard was also analyzed for chlorine in similar way. The precision of the method was found to be 25% (1 σ) at ng level in most of the cases. (author)

  11. Total reflection x-ray analysis of metals in blood samples

    International Nuclear Information System (INIS)

    Nakamura, Takuya; Matsui, Hiroshi; Kawamata, Masaya

    2009-01-01

    The sample preparation for TXRF (total reflection X-ray fluorescence) quantitative analysis of trace elements in human blood samples was investigated. In the TXRF analysis, a solution sample is dropped and dried on a flat substrate, and then the dried residue is measured. In this case, the dried residue should be flat not to disturb X-ray total reflection on the substrate. In addition, it is required to simply measure the whole blood sample by TXRF method, although a serum is analyzed in many cases. Thus, we studied the optimum conditions of the sample preparation of the whole blood by adding the pure water to apply Hemolysis phenomenon, where blood cells are destroyed due to different of the osmotic pressure, leading to flat residue. It was found that the best S/B ratio was obtained when the whole blood was diluted 8 times with pure water. Moreover, it was investigated the influence of the surface chemical condition of the glass substrate on the shape of the dried reside of the blood sample. When the surface of the glass substrate was hydrophilic, the shape of the dried residues was not uniform, as a result, the quantitative data of TXRF analysis gave a large deviation. On the other hand, when the surface of the glass was hydrophobic, the shape of the residue was almost uniform, as a result, a good reproducibility was obtained. Another problem was an outer ring of the dried residue of the blood. This uneven ring absorbs the primary X-rays, caused to low determined quantitative data. Thus, we tried the heating way of the dropped blood sample at a high temperature of 200 degrees. In this case, the blood sample was dried immediately, and a flat homogeneous dried residue was obtained without the outer ring. Using the optimized conditions for sample preparation, human blood sample was quantitatively measured by TXRF and ICP-AES. A good agreement was obtained in TXRF and ICP-AES determinations; however, the measurement of Cl and Br will be an advantage of TXRF, because

  12. Beer analysis by synchrotron radiation total reflection X-ray fluorescence (SR-TXRF)

    Energy Technology Data Exchange (ETDEWEB)

    Moreira, Silvana [Universidade Estadual de Campinas, SP (Brazil). Faculdade de Engenharia Civil, Arquitetura e Urbanismo. Dept. de Recursos Hidricos]. E-mail: silvana@fec.unicamp.br; Vives, Ana Elisa S. de [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil). Faculdade de Engenharia, Arquitetura e Urbanismo]. E-mail: aesvives@unimep.br; Nascimento Filho, Virgilio F. [Centro de Energia Nuclear na Agricultura (CENA), Piracicaba, SP (Brazil). Lab. de Instrumentacao Nuclear]. E-mail: virgilio@cena.usp.br; Zucchi, Orgheda L.D.A. [Sao Paulo Univ., Ribeirao Preto, SP (Brazil). Faculdade de Ciencias Farmaceuticas de Ribeirao Preto]. E-mail: olzucchi@fcfrp.usp.br

    2005-07-01

    In this work the concentrations of P, S, Cl, K, Ca, Mn, Fe, Zn and Br in twenty-nine brands of national and international beers were determined by Synchrotron Radiation Total Reflection X-Ray Fluorescence analysis (SR-TXRF). The results were compared with the limits established by the Brazilian Legislation and the nutritive values established by National Agricultural Library (NAL). The measurements were performed at the X-ray Fluorescence Beamline at Synchrotron Light Source Laboratory, in Campinas, Sao Paulo, Brazil, using a polychromatic beam for excitation. A small volume of 5 {mu}L of sample beers containing just an internal standard, used to correct geometry effects, were analyzed without any pre-treatment. The measuring time was 100 s and the detection limits obtained varied from 1{mu}g.L{sup -1} for Mn and Fe to 15{mu}g.L{sup -1} for P. (author)

  13. Total Reflection X-ray Fluorescence attachment module modified for analysis in vacuum

    International Nuclear Information System (INIS)

    Wobrauschek, P.; Streli, C.; Kregsamer, P.; Meirer, F.; Jokubonis, C.; Markowicz, A.; Wegrzynek, D.; Chinea-Cano, E.

    2008-01-01

    Based on the design of the low cost Total Reflection X-Ray Fluorescence attachment module available since 1986 from Atominstitut (WOBRAUSCHEK-module) which can be attached to existing X-ray equipment, a new version was developed which allows the analysis of samples in vacuum. This design was in particular possible as the Peltier cooled light weight Silicon Drift Detector is following all adjustment procedures for total reflection as angle rotation and linear motion. The detector is mounted through a vacuum feed and O-ring tightening to the small vacuum chamber. The standard 30 mm round quartz, Si-wafer or Plexiglas reflectors are used to carry the samples. The reflectors are placed on the reference plane with the dried sample down looking facing in about 0.5 mm distance the up looking detector window. The reflectors are resting on 3 steel balls defining precisely the reference plane for the adjustment procedure. As the rotation axis of the module is in the plane of the reflector surface, angle dependent experiments can be made to distinguish between film and particulate type contamination of samples. Operating with a Mo anode at 50 kV and 40 mA with a closely attached multilayer monochromator and using a 10 mm 2 KETEK silicon drift detector with 8 μm Be window, a sensitivity of 70 cps/ng for Rb was measured and detection limits of 2 pg were obtained

  14. Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation

    International Nuclear Information System (INIS)

    Kohn, V. G.

    2008-01-01

    The effect of total reflection (switching) of a spherical X-ray wave in the case of Laue diffraction in a crystal with bending deformation is analyzed by the trajectory method. Qualitative analytical description and computation of the spatial structure of the reflected beam for large and small distances between the spherical-wave source and the crystal are performed. The mechanism of much more efficient reflection of an X-ray beam by a deformed crystal in comparison with a perfect crystal is clearly demonstrated. It is also shown that the trajectory method is very convenient for description of the total reflection phenomenon.

  15. Trajectory method in the theory of Laue diffraction of X rays in crystals: II. Effect of total reflection at bending deformation

    International Nuclear Information System (INIS)

    Kohn, V. G.

    2008-01-01

    The effect of total reflection (switching) of a spherical X-ray wave in the case of Laue diffraction in a crystal with bending deformation is analyzed by the trajectory method. Qualitative analytical description and computation of the spatial structure of the reflected beam for large and small distances between the spherical-wave source and the crystal are performed. The mechanism of much more efficient reflection of an X-ray beam by a deformed crystal in comparison with a perfect crystal is clearly demonstrated. It is also shown that the trajectory method is very convenient for description of the total reflection phenomenon

  16. On revealing the vertical structure of nanoparticle films with elemental resolution: A total external reflection X-ray standing waves study

    Energy Technology Data Exchange (ETDEWEB)

    Zargham, Ardalan, E-mail: zargham@ifp.uni-bremen.d [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Schmidt, Thomas; Flege, Jan Ingo; Sauerbrey, Marc; Hildebrand, Radowan [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany); Roehe, Sarah; Baeumer, Marcus [Applied and Physical Chemistry, University of Bremen, Leobener Str. 2, 28359, Bremen (Germany); Falta, Jens [Institute of Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen (Germany)

    2010-02-15

    We present a promising combination of methods to precisely determine the morphology of nanostructures, drawing on the example of monodisperse CoPt{sub 3} nanoparticle films deposited by spin coating and dip coating techniques on functionalized Au substrates. Ex-situ X-ray standing waves in total external reflection combined with X-ray reflectivity measurements were employed to determine element-specific atomic-density distributions in vertical direction.

  17. Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures

    International Nuclear Information System (INIS)

    Rieder, R.; Wobrauschek, P.; Ladisich, W.; Streli, C.; Aiginger, H.; Garbe, S.; Gaul, G.; Knoechel, A.; Lechtenberg, F.

    1995-01-01

    To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV. Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively. ((orig.))

  18. Single particle transfer for quantitative analysis with total-reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Esaka, Fumitaka; Esaka, Konomi T.; Magara, Masaaki; Sakurai, Satoshi; Usuda, Shigekazu; Watanabe, Kazuo

    2006-01-01

    The technique of single particle transfer was applied to quantitative analysis with total-reflection X-ray fluorescence (TXRF) spectrometry. The technique was evaluated by performing quantitative analysis of individual Cu particles with diameters between 3.9 and 13.2 μm. The direct quantitative analysis of the Cu particle transferred onto a Si carrier gave a discrepancy between measured and calculated Cu amounts due to the absorption effects of incident and fluorescent X-rays within the particle. By the correction for the absorption effects, the Cu amounts in individual particles could be determined with the deviation within 10.5%. When the Cu particles were dissolved with HNO 3 solution prior to the TXRF analysis, the deviation was improved to be within 3.8%. In this case, no correction for the absorption effects was needed for quantification

  19. Parameter study of self-absorption effects in Total Reflection X-ray Fluorescence-X-ray Absorption Near Edge Structure analysis of arsenic

    International Nuclear Information System (INIS)

    Meirer, F.; Pepponi, G.; Streli, C.; Wobrauschek, P.; Kregsamer, P.; Zoeger, N.; Falkenberg, G.

    2008-01-01

    Total reflection X-ray Fluorescence (TXRF) analysis in combination with X-ray Absorption Near Edge Structure (XANES) analysis is a powerful method to perform chemical speciation studies at trace element levels. However, when measuring samples with higher concentrations and in particular standards, damping of the oscillations is observed. In this study the influence of self-absorption effects on TXRF-XANES measurements was investigated by comparing measurements with theoretical calculations. As(V) standard solutions were prepared at various concentrations and dried on flat substrates. The measurements showed a correlation between the damping of the oscillations and the As mass deposited. A Monte-Carlo simulation was developed using data of the samples shapes obtained from confocal white light microscopy. The results showed good agreement with the measurements; they confirmed that the key parameters are the density of the investigated atom in the dried residues and the shape of the residue, parameters that combined define the total mass crossed by a certain portion of the incident beam. The study presents a simple approach for an a priori evaluation of the self-absorption in TXRF X-ray absorption studies. The consequences for Extended X-ray Absorption Fine Structure (EXAFS) and XANES measurements under grazing incidence conditions are discussed, leading to the conclusion that the damping of the oscillations seems to make EXAFS of concentrated samples non feasible. For XANES 'fingerprint' analysis samples should be prepared with a deposited mass and sample shape leading to an acceptable absorption for the actual investigation

  20. Bright circularly polarized soft X-ray high harmonics for X-ray magnetic circular dichroism.

    Science.gov (United States)

    Fan, Tingting; Grychtol, Patrik; Knut, Ronny; Hernández-García, Carlos; Hickstein, Daniel D; Zusin, Dmitriy; Gentry, Christian; Dollar, Franklin J; Mancuso, Christopher A; Hogle, Craig W; Kfir, Ofer; Legut, Dominik; Carva, Karel; Ellis, Jennifer L; Dorney, Kevin M; Chen, Cong; Shpyrko, Oleg G; Fullerton, Eric E; Cohen, Oren; Oppeneer, Peter M; Milošević, Dejan B; Becker, Andreas; Jaroń-Becker, Agnieszka A; Popmintchev, Tenio; Murnane, Margaret M; Kapteyn, Henry C

    2015-11-17

    We demonstrate, to our knowledge, the first bright circularly polarized high-harmonic beams in the soft X-ray region of the electromagnetic spectrum, and use them to implement X-ray magnetic circular dichroism measurements in a tabletop-scale setup. Using counterrotating circularly polarized laser fields at 1.3 and 0.79 µm, we generate circularly polarized harmonics with photon energies exceeding 160 eV. The harmonic spectra emerge as a sequence of closely spaced pairs of left and right circularly polarized peaks, with energies determined by conservation of energy and spin angular momentum. We explain the single-atom and macroscopic physics by identifying the dominant electron quantum trajectories and optimal phase-matching conditions. The first advanced phase-matched propagation simulations for circularly polarized harmonics reveal the influence of the finite phase-matching temporal window on the spectrum, as well as the unique polarization-shaped attosecond pulse train. Finally, we use, to our knowledge, the first tabletop X-ray magnetic circular dichroism measurements at the N4,5 absorption edges of Gd to validate the high degree of circularity, brightness, and stability of this light source. These results demonstrate the feasibility of manipulating the polarization, spectrum, and temporal shape of high harmonics in the soft X-ray region by manipulating the driving laser waveform.

  1. Impurities determination in uranium eluates by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Vazquez, Cristina; Bellavigna, Horacio J.; Eppis, Maria R.; Ramella, Jose L.

    1999-01-01

    The chemical control of impurities in nuclear materials is indispensable in order to assure an efficient operation of the reactors. The maximum concentration admitted depends of the elements and in most cases are in the parts per billion range. Conventional analytical methods require a pre-concentration treatment of the sample and a previous separation of the matrix (uranium). This paper investigates the use of the total reflection X-ray fluorescence as an alternative methodology for the determination of impurities in nuclear materials, namely K, Ca, Ti, Cr, Mn, Fe, Ni, Cu and As. The detection limits obtained were in the range of 0.1 to 20 ng/ml for a 1000 seconds counting time. (author)

  2. A novel x-ray circularly polarized ranging method

    International Nuclear Information System (INIS)

    Song Shi-Bin; Xu Lu-Ping; Zhang Hua; Shen Yang-He; Gao Na

    2015-01-01

    Range measurement has found multiple applications in deep space missions. With more and further deep space exploration activities happening now and in the future, the requirement for range measurement has risen. In view of the future ranging requirement, a novel x-ray polarized ranging method based on the circular polarization modulation is proposed, termed as x-ray circularly polarized ranging (XCPolR). XCPolR utilizes the circular polarization modulation to process x-ray signals and the ranging information is conveyed by the circular polarization states. As the circular polarization states present good stability in space propagation and x-ray detectors have light weight and low power consumption, XCPolR shows great potential in the long-distance range measurement and provides an option for future deep space ranging. In this paper, we present a detailed illustration of XCPolR. Firstly, the structure of the polarized ranging system is described and the signal models in the ranging process are established mathematically. Then, the main factors that affect the ranging accuracy, including the Doppler effect, the differential demodulation, and the correlation error, are analyzed theoretically. Finally, numerical simulation is carried out to evaluate the performance of XCPolR. (paper)

  3. Polarization and dipole effects in hard X-ray photoelectron spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Novak, M. [Universite Libre de Bruxelles, Service de Metrologie Nucleaire (CP 165/84), 50 av. F. D. Roosevelt, B-1050 Brussels (Belgium); Pauly, N., E-mail: nipauly@ulb.ac.be [Universite Libre de Bruxelles, Service de Metrologie Nucleaire (CP 165/84), 50 av. F. D. Roosevelt, B-1050 Brussels (Belgium); Dubus, A. [Universite Libre de Bruxelles, Service de Metrologie Nucleaire (CP 165/84), 50 av. F. D. Roosevelt, B-1050 Brussels (Belgium)

    2012-03-15

    Highlights: Black-Right-Pointing-Pointer X-rays are unpolarized or linearly polarized. Black-Right-Pointing-Pointer A difference of polarization implies a variation in path travelled by the photoelectrons. Black-Right-Pointing-Pointer We show the influence of the polarization on the partial intensity distributions. Black-Right-Pointing-Pointer We also point out the influence of the dipole approximation. Black-Right-Pointing-Pointer We use Monte Carlo simulations. - Abstract: Hard X-ray photoelectron spectroscopy (HXPS) using X-rays in the 1.5-15 keV energy range generated by synchrotron sources becomes an increasingly important analysis technique due to its potential for bulk sensitive measurements. However, besides their high energy, another characteristic of photons generated by synchrotron sources is their linear polarization while X-rays from Al K{alpha} or Mg K{alpha} for instance are unpolarized. This difference implies a possible variation in total path travelled by the photoelectrons generated by the X-rays inside the medium and consequently a modification of the resulting spectrum shape. We show the influence of the polarization on the partial intensity distributions, namely the number of electrons escaping after n inelastic scattering events, for photoelectron with energies of 0.5, 1, 2, 3, 4 and 5 keV and originating from Si 1s{sub 1/2}, Cu 1s{sub 1/2}, Cu 2p{sub 3/2}, Au 4d{sub 3/2} and Au 4f{sub 7/2} subshells. Moreover, we point out the influence of the dipole approximation leading to an underestimation of the partial intensity distributions due to the neglect of the forward-backward asymmetry of the angular photoelectron distribution.

  4. Total and available metal contents in sediments by synchrotron radiation total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Moreira, Silvana; Sobrinho, Gilmar A.; Jesus, Edgar F.O. de; Lopes, Ricardo T.

    2002-01-01

    In this work the total and available contents of Al, Si, Cl, K, Mn, Fe, Co, Ni, Cu, Zn, Sr, Zr, Ba, Ce and Pb in sediments from river Atibaia were determined by Synchrotron Radiation Total Reflection X-Ray Fluorescence technique. The detection limits for K series varies from 200 ng.mL -1 for Al to 2 ng.mL -1 for Zn while for L series the value varies from 20 ng.mL -1 for Ba to 10 ng.mL -1 for Pb. The samples were submitted to two different processes, in order to obtain the total and biological available metal contents. The information about metal content is a important parameter for a correct evaluation about the hydrologic cycle in Piracicaba basin. All the measure were carried out at the National Synchrotron Light Laboratory, Campinas, SP, Brazil, using a white beam for excitation. (author)

  5. Trace elements determination in red and white wines using total-reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Anjos, M.J.; Lopes, R.T.; Jesus, E.F.O. de; Moreira, S.; Barroso, R.C.; Castro, C.R.F.

    2003-01-01

    Several wines produced in different regions from south of Brazil and available in markets in Rio de Janeiro were analyzed for their contents of elements such as: P, S, Cl, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb and Sr. Multi-element analysis was possible with simple sample preparation and subsequent analysis by total-reflection X-ray fluorescence using synchrotron radiation. The measurement was carried at the X-ray fluorescence beamline in the Synchrotron Light Source Laboratory in Campinas, Brazil. The levels of the various elements obtained were lower in the Brazilian wines than the values generally found in the literature. The present study indicates the capability of multi-element analysis for determining the contents of various elements present in wines coming from Brazil vineyards by using a simple, sensitive and precise method

  6. Application of total reflection X-ray fluorescence spectrometry for ...

    Indian Academy of Sciences (India)

    Applicability of total reflection X-ray fluorescence (TXRF) spectrometry for trace elemental analysis of rainwater samples was studied. The study was used to develop these samples as rainwater standards by the National University of Singapore (NUS). Our laboratory was one of the participants to use TXRF for this study.

  7. Modifications to 8x8 dynamical theory: Polarizations redefined according to x-ray diffraction convention

    International Nuclear Information System (INIS)

    Macrander, A.T.; Blasdell, R.C.

    1993-09-01

    Dynamical x-ray diffraction theory can be cast in matrix form. In recent years, an 8x8 matrix theory was developed that treated asymmetric reflections from strained crystals. The polarization of the incident, specularly reflected, reflected diffracted, transmitted diffracted, and transmitted electromagnetic wave fields were all defined as s or p. That is, polarizations were defined with respect to the plane containing the incident beam direction and the surface normal. The authors present modifications of the theory to treat σ and π polarizations for Bragg diffraction from asymmetric planes, that is, for polarizations defined with respect to the plane containing the incident beam direction and the reciprocal lattice vector for Bragg diffraction. They present results of this theory for unstrained crystals in the inclined geometry. In this geometry the incident beam wavevector, the reciprocal lattice vector, and the surface normal are not coplanar. The inclined crystal geometry appears promising for use in a high-heat-load monochromator for undulator radiation at the Advanced Photon Source. As expected, they find a weak π-polarization component in the diffracted beam when the polarization of the incident beam is pure σ

  8. Reflection of attosecond x-ray free electron laser pulses

    International Nuclear Information System (INIS)

    Hau-Riege, Stefan P.; Chapman, Henry N.

    2007-01-01

    In order to utilize hard x-ray free electron lasers (XFEL's) when they are extended to attosecond pulse lengths, it is necessary to choose optical elements with minimal response time. Specular grazing-incidence optics made of low-Z materials are popular candidates for reflectors since they are likely to withstand x-ray damage and provide sufficiently large reflectivities. Using linear-optics reflection theory, we calculated the transient reflectivity of a delta-function electric pulse from a homogenous semi-infinite medium as a function of angle of incidence for s- and p-polarized light. We specifically considered the pulse response of beryllium, diamond, silicon carbide, and silicon, all of which are of relevance to the XFEL's that are currently being built. We found that the media emit energy in a damped oscillatory way, and that the impulse-response times are shorter than 0.3 fs for normal incidence. For grazing incidence, the impulse-response time is substantially shorter, making grazing-incidence mirrors a good choice for deep subfemtosecond reflective optics

  9. Linear polarization observations of some X-ray sources

    International Nuclear Information System (INIS)

    Shakhovskoy, N.M.; Efimov, Yu.S.

    1975-01-01

    Multicolour linear polarization of optical radiation of the X-ray sources Sco X-1, Cyg X-2, Cyg X-1 and Her X-1 was measured at the Crimean Astrophysical Observatory in 1970-1973. These observations indicate that polarization of Sco X-1 in the ultraviolet, blue and red spectral regions appears to be variable. No statistically significant variations of polarization were found for the other three sources observed. (Auth.)

  10. Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Ovari, M.; Streli, C.; Wobrauschek, P.; Zaray, Gy.

    2009-01-01

    There is a growing interest in determination of low Z elements, i.e., carbon to phosphorus, in biological samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). Biofilms can be used for biomonioring purposes in the aquatic environment. Besides the trace metals, especially the determination of the carbon content is important for the better understanding of the early stage of biofilm formation. For this, an ATI low Z spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a Si(Li) detector with ultra thin window was used. Biofilms were grown on two different artificial supports (granite and plexiglass), freeze dried, suspended in high purity water and analyzed. As an internal standard the natural titanium content of the biofilms was used. The accuracy of the method was checked by total carbon measurement using a combusting carbon analyzer.

  11. Determination of carbon in natural freshwater biofilms with total reflection X-ray fluorescence spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Ovari, M. [Department of Analytical Chemistry, Eoetvoes University, Budapest, H-1117, Budapest, Pazmany Peter stny. 1/a. (Hungary)], E-mail: ovari@chem.elte.hu; Streli, C.; Wobrauschek, P. [Atominstitut of the Austrian Universities, TU-Wien, Stadionallee 2, A-1020, Wien (Austria); Zaray, Gy. [Department of Analytical Chemistry, Eoetvoes University, Budapest, H-1117, Budapest, Pazmany Peter stny. 1/a. (Hungary); Cooperative Research Centre of Environmental Chemistry, Eoetvoes University, Budapest, H-1117, Budapest, Pazmany Peter stny. 1/a. (Hungary)

    2009-08-15

    There is a growing interest in determination of low Z elements, i.e., carbon to phosphorus, in biological samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon). Biofilms can be used for biomonioring purposes in the aquatic environment. Besides the trace metals, especially the determination of the carbon content is important for the better understanding of the early stage of biofilm formation. For this, an ATI low Z spectrometer equipped with Cr-anode X-ray tube, multilayer monochromator, vacuum chamber, and a Si(Li) detector with ultra thin window was used. Biofilms were grown on two different artificial supports (granite and plexiglass), freeze dried, suspended in high purity water and analyzed. As an internal standard the natural titanium content of the biofilms was used. The accuracy of the method was checked by total carbon measurement using a combusting carbon analyzer.

  12. Synchrotron radiation total reflection X-ray fluorescence (SR-TXRF) for evaluation of food contamination

    International Nuclear Information System (INIS)

    Vives, A.E.S.; Brienza, S.M.B.; Moreira, S.; Zucchi, O.L.A.; Nascimento Filho, V.F.

    2006-01-01

    The objective of this study was to use synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF) for the determination of metals and other elements in food available to the population in commercial establishments, in order to evaluate the risks of contamination by these products. The analyzed species were vegetables, leafy vegetables, fruits, cereal and grain. The results indicated that some species were contaminated by Cr, Cu, Zn and Pb with concentrations much higher than the reference values. (author)

  13. An electromagnetic helical undulator for polarized X-rays

    International Nuclear Information System (INIS)

    Gluskin, E.; Vinokurov, N.; Tcheskidov, V.; Medvedko, A.; Evtushenko, Y.; Kolomogorov, V.; Vobly, P.; Antokhin, E.; Ivanov, P.; Vasserman, I. B.; Trakhtenberg, E. M.; Den Hartog, P. K.; Deriy, B.; Erdmann, M.; Makarov, O.; Moog, E. R.

    1999-01-01

    Linearly and circularly polarized x-rays have been very successfully applied to the study of the properties of materials. Many applications can benefit from the availability of energy-turnable, high-brilliance x-ray beams with adjustable polarization properties. A helical undulator that can generate beams of variable (linear to circular) polarization has been designed and built by the Budker Institute of Nuclear Physics and the Advanced Photon Source. The first harmonic of this 12.8-cm-period device will cover the energy range from 0.4 keV to 3.5 keV. An important feature of this fully electromagnetic device is that it will allow one to generate 100% horizontally (K x =O)or vertically (K y =O) plane-polarized radiation, which will enable many experiments otherwise not technically feasible. With symmetric deflection parameters (K x =K y ), the on-axis radiation will be circularly polarized, with a user-selectable handedness. The polarization can be changed at rates up to 10 Hz

  14. An experimental measurement of metal multilayer x-ray reflectivity degradation due to intense x-ray flux

    International Nuclear Information System (INIS)

    Hockaday, M.Y.P.

    1987-06-01

    The degradation of the x-ray reflection characteristics of metal multilayer Bragg diffractors due to intense x-ray flux was investigated. The Z-pinch plasma produced by PROTO II of Sandia National Laboratories, Albuquerque, New Mexico, was used as the source. The plasma generated total x-ray yields of as much as 40 kJ with up to 15 kJ in the neon hydrogen- and helium-like resonance lines in nominal 20-ns pulses. Molybdenum-carbon, palladium-carbon, and tungsten-carbon metal multilayers were placed at 15 and 150 cm from the plasma center. The multilayers were at nominal angles of 5 0 and 10 0 to diffract the neon resonance lines. The time-integrated x-ray reflection of the metal multilayers was monitored by x-ray film. A fluorescer-fiber optic-visible streak camera detector system was then used to monitor the time-resolved x-ray reflection characteristics of 135 A- 2d tungsten-carbon multilayers. A large specular component in the reflectivity prevented determination of the rocking curve of the multilayer. For a neon implosion onto a vanadium-doped polyacrylic acid foam target shot, detailed modeling was attempted. The spectral flux was determined with data from 5 XRD channels and deconvolved using the code SHAZAM. The observed decay in reflectivity was assumed to correspond to the melting of the first tungsten layer. A ''conduction factor'' of 82 was required to manipulate the heat loading of the first tungsten layer such that the time of melting corresponded to the observed decay. The power at destruction was 141 MW/cm 2 and the integrated energy at destruction was 2.0 J/cm 2 . 82 refs., 66 figs., 10 tabs

  15. Colouration of medieval glass bracelets studied by total reflection x-ray fluorescence analysis

    International Nuclear Information System (INIS)

    Detcheva, Albena; Velinova, Ralitsa; Ivanova, Elisaveta; Jordanov, Juri; Karadjov, Metody

    2014-01-01

    The contents of 3d-transition metals (Ti, V, Cr, Mn, Fe, Co, Ni, Cu and Zn) in fragments of medieval glass bracelets, found in the necropolis of Stambolovo and the castle of Mezek, Bulgaria, were determined by total reflection X-ray fluorescence (TXRF) analysis using gallium as internal standard. The samples were analysed as slurries in Triton X 114. The experimental parameters: grain size of the glass sample, concentrations of glass sample, Triton X114 and internal standard in the slurry, volume of the slurry aliquot taken for analysis, as well as the excitation time, were optimised. For method validation the certified reference material BAM-S005 Type A soda-lime glass was used. It was proven that the elements Co, Mn and Fe are responsible for colour generation in the investigated glass samples. The precision of the determinations is characterised by an RSD in the range 3–11%

  16. Determination of heavy metals in Damascus drinking water using total reflection x-ray fluorescence

    International Nuclear Information System (INIS)

    Bakraji, E. H.; Karajo, J.

    2000-01-01

    Total reflection x-ray fluorescence spectrometry and chemical preconcentration have applied for multi-elemental analysis of Damascus drinking water. Water was taken directly from taps of several city sectors and analyzed for the following trace elements: Ti, V, Cr, Fe, Co, Ni, Cu, Zn, Se and Pb. The detection limits were found to be in the range of 0.1 to 0.4 μg/l. The mean levels of trace elements in the Damascus drinking water were below the World Health Organization drinking water quality guidelines. (author)

  17. Synchrotron total reflection X-ray fluorescence at BL-16 microfocus beamline of Indus-2

    Energy Technology Data Exchange (ETDEWEB)

    Tiwari, M. K., E-mail: mktiwari@rrcat.gov.in; Singh, A. K., E-mail: mktiwari@rrcat.gov.in; Das, Gangadhar, E-mail: mktiwari@rrcat.gov.in; Chowdhury, Anupam, E-mail: mktiwari@rrcat.gov.in; Lodha, G. S., E-mail: mktiwari@rrcat.gov.in [Indus Synchrotrons Utilisation Division, Raja Ramanna Centre for Advanced Technology, Indore-452013 (India)

    2014-04-24

    Determination of ultra trace elements is important in many disciplines both in basic and applied sciences. Numerous applications show their importance in medical science, environmental science, materials science, food processing and semiconductor industries and in maintaining the quality control of ultra pure chemicals and reagents. We report commissioning of a synchrotron based total reflection x-ray fluorescence (TXRF) facility on the BL-16 microfocus beamline of Indus-2. This paper describes the performance of the BL-16 TXRF spectrometer and the detailed description of its capabilities through examples of measured results.

  18. The capabilities of total reflection X-ray fluorescence in the polymeric analytical field

    International Nuclear Information System (INIS)

    Vazquez, Cristina

    2004-01-01

    This paper presents the capabilities of total reflection X-ray fluorescence (TXRF) as analytical technique specially focused in high-viscosity polymer dispersions. Appropriate sample preparation procedures are described taking into account the time stability of these dispersions. Special remarks considering different ways for drying samples in order to obtain the most uniform deposited film are investigated focusing on the behavior of aqueous and viscous systems. Due to the difficulty found for obtaining a homogeneous mixture between sample and internal standard in such systems, the use of Compton incoherent scattering is discussed as an alternative procedure for trace quantification in high viscous systems without any mixing processes

  19. Determination of lead in clay enameled by X-ray fluorescence technique in Total reflection and by Scanning Electron Microscopy

    International Nuclear Information System (INIS)

    Zarazua O, G.; Carapia M, L.

    2000-01-01

    This work has the objective of determining lead free in the glazed commercial stewing pans using the X-ray fluorescence technique in Total reflection (FRX) and the observation and semiquantitative determination of lead by Analytical Scanning Electron Microscopy (ASEM). (Author)

  20. New structural studies of liquid crystal by reflectivity and resonant X-ray diffraction

    International Nuclear Information System (INIS)

    Fernandes, P.

    2007-04-01

    This memory presents three structural studies of smectic Liquid Crystals by reflectivity and resonant diffraction of X-rays. It is divided in five chapters. In the first a short introduction to Liquid Crystals is given. In particular, the smectic phases that are the object of this study are presented. The second chapter is consecrated to the X-ray experimental techniques that were used in this work. The three last chapters present the works on which this thesis can be divided. Chapter three demonstrates on free-standing films of MHPOBC (historic liquid crystal that possesses the antiferroelectric sub-phases) the possibility to extend the technique of resonant X-ray diffraction to liquid crystals without resonant element. In the fourth chapter the structure of the B 2 liquid crystal phase of bent-core molecules (or banana molecules) is elucidated by using resonant X-ray diffraction combined with polarization analysis of the diffracted beam. A model of the polarization of the resonant beam diffracted by four different structures proposed for the B 2 phase is developed in this chapter. In the fifth chapter a smectic binary mixture presenting a very original critical point of phase separation is studied by X-ray reflectivity and optical microscopy. A concentration gradient in the direction perpendicular to the plane of the film seems to be induced by the free-standing film geometry. The results of a simplified model of the system are compatible with this interpretation

  1. A bromine-based dichroic X-ray polarization analyser

    CERN Document Server

    Collins, S P; Brown, S D; Thompson, P

    2001-01-01

    We have demonstrated the advantages offered by dichroic X-ray polarization filters for linear polarization analysis, and describe such a device, based on a dibromoalkane/urea inclusion compound. The polarizer has been successfully tested by analysing the polarization of magnetic diffraction from holmium.

  2. X-ray reflectivity and surface roughness

    International Nuclear Information System (INIS)

    Ocko, B.M.

    1988-01-01

    Since the advent of high brightness synchrotron radiation sources there has been a phenomenal growth in the use of x-rays as a probe of surface structure. The technique of x-ray reflectivity is particularly relevant to electrochemists since it is capable of probing the structure normal to an electrode surface in situ. In this paper the theoretical framework for x-ray reflectivity is reviewed and the results from previous non-electrochemistry measurements are summarized. These measurements are from the liquid/air interface (CCl 4 ), the metal crystal vacuum interface (Au(100)), and from the liquid/solid interface(liquid crystal/silicon). 34 refs., 5 figs

  3. 1. Latin American Workshop on Total Reflection X-Ray Fluorescence (TXRF) and its Applications: TARABANA 99. Programme and Abstracts

    International Nuclear Information System (INIS)

    Vegas C, Fredy; Greaves N, Eduardo; Marco P, Lue-Meru

    1999-01-01

    It concerns about the advances in Total Reflection X-Ray Fluorescence (TXRF) instrumentation; structure, characteristic and potential of TXRF equipment used for chemical multielemental survey; TXRF: an approach to nano analysis; microanalytical investigation of environmental samples by TXRF spectrometry; TXRF of low Z elements; assessment of serum selenium levels in 2 month old sucking calves using TXRF: A powerful method to investigate the elemental composition of spheroids; environmental applications of TXRF; use of modifiers for the elimination in situ of chlorides in the analysis of TXRF; experimental methodology and analysis spectra for the determination of mercury by means of TXRF using amalgamation with gold; multielemental analysis of human amniotic fluid by use of Total Reflection X-Ray Fluorescence and rutherford forward scattering; determination of metal in samples of handmade penca; determination of oligo elements, platinum and relationship Zn/Cu in samples of blood serum and urine in oncological pediatric patient [es

  4. Recent trends in total reflection X-ray fluorescence spectrometry for biological applications

    International Nuclear Information System (INIS)

    Szoboszlai, Norbert; Polgari, Zsofia; Mihucz, Victor G.; Zaray, Gyula

    2009-01-01

    This review is focused on the application of total reflection X-ray fluorescence (TXRF) spectrometry in the field of biological research. In the last decade, most papers were published by authors who applied laboratory-scale TXRF equipments. The application of synchrotron radiation as excitation source (SR-TXRF) shows a slowly increasing tendency. In the cited papers the micro-, trace and multielement capability of these TXRF techniques was demonstrated in the clinical and medical laboratory practice, as well as in various plant physiological studies. For speciation of elements in biological matrices, the TXRF was used as element specific detector following an off-line separation step (e.g., thin layer chromatography, high performance liquid chromatography), however, these off-line methods are not competitive with the on-line coupled HPLC-inductively coupled plasma mass spectrometry

  5. Elemental concentration analysis in prostate tissues using total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Leitão, R.G.; Palumbo, A.; Souza, P.A.V.R.; Pereira, G.R.; Canellas, C.G.L.; Anjos, M.J.; Nasciutti, L.E.; Lopes, R.T.

    2014-01-01

    Prostate cancer (PCa) currently represents the second most prevalent malignant neoplasia in men, representing 21% of all cancer cases. Benign Prostate Hyperplasia (BPH) is an illness prevailing in men above the age of 50, close to 90% after the age of 80. The prostate presents a high zinc concentration, about 10-fold higher than any other body tissue. In this work, samples of human prostate tissues with cancer, BPH and normal tissue were analyzed utilizing total reflection X-ray fluorescence spectroscopy using synchrotron radiation technique (SR-TXRF) to investigate the differences in the elemental concentrations in these tissues. SR-TXRF analyses were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, São Paulo. It was possible to determine the concentrations of the following elements: P, S, K, Ca, Fe, Cu, Zn and Rb. By using Mann–Whitney U test it was observed that almost all elements presented concentrations with significant differences (α=0.05) between the groups studied. - Highlights: ► Prostate cancer is the most frequently diagnosed form of cancer in men. ► Intracellular Zn is correlated with proliferation, differentiation, or apoptosis. ► The prostate gland accumulate high concentration of Zn. ► SR-TXRF is a technique widely used in the analysis of low concentration in samples

  6. Determination of sulphur with total reflection x-ray spectrometry

    International Nuclear Information System (INIS)

    Steinmeyer, S.; Kolbesen, B.O.

    2000-01-01

    The potential and limitations of total reflection x-ray spectrometry (TXRF) were tested for the quantitative determination of the light element sulphur in inorganic and biological samples. As representatives of inorganic samples alkali, transition metal, magnesium and aluminum sulphates were investigated. As biological samples the sulphur containing amino acid methionine and the pharmaceutical drug insulin were chosen. All measurements were performed on a TXRF-spectrometer EXTRA IIA (Atomika Instruments, Oberschleissheim/Germany) using tungsten L-radiation as the excitation tube. Various concentrations of all samples ranging from 20 mg/l to 0.5 mg/l were determined. In addition the surface topography and thickness of the dry residue of these samples were investigated with SEM and a thickness profilometer (Alpha-Step). The result show that the reliable determination of sulphur in sulphates depends on the cation involved. Alkali sulphates like Na 2 SO 4 , or K 2 SO 4 form bulky residues resulting in significant deviations of the recovery rate of sulphur. In this case the use of smoothing detergents like 1 % HF, 1 % malic acid and 2 % hydrazinhydrat was found to be necessary for accurate determination. The results for the biological samples agree well with the expected values. The investigations lead to the conclusion that TXRF combined with a proper samples preparation is well suited for the determination of sulphur in different samples with various concentrations and matrices. (author)

  7. Thin film characterization by total reflection x-ray fluorescence

    International Nuclear Information System (INIS)

    Danel, Adrien; Nolot, Emmanuel; Veillerot, Marc; Olivier, Segolene; Decorps, Tifenn; Calvo-Munoz, Maria-Luisa; Hartmann, Jean-Michel; Lhostis, Sandrine; Kohno, Hiroshi; Yamagami, Motoyuki; Geoffroy, Charles

    2008-01-01

    Sensitive and accurate characterization of films thinner than a few nm used in nanoelectronics represents a challenge for many conventional production metrology tools. With capabilities in the 10 10 at/cm 2 , methods usually dedicated to contamination analysis appear promising, especially Total-reflection X-Ray Fluorescence (TXRF). This study shows that under usual configuration for contamination analysis, with incident angle smaller than the critical angle of the substrate, TXRF signal saturation occurs very rapidly for dense films (below 0.5 nm for HfO 2 films on Si wafers using a 9.67 keV excitation at 0.5 deg.). Increasing the incident angle, the range of linear results can be extended, but on the other hand, the TXRF sensitivity is degraded because of a strong increase of the measurement dead time. On HfO 2 films grown on Si wafers, an incident angle of 0.32 deg. corresponding to a dead time of 95% was used to achieve linear analysis up to 2 nm. Composition analysis by TXRF, and especially the detection of minor elements into thin films, requires the use of a specific incident angle to optimize sensitivity. Although quantitative analyses might require specific calibration, this work shows on Co-based films that the ratio between minor elements (W, P, Mo) and Co taking into account their relative sensitivity factors is a good direct reading of the composition

  8. Total reflection X-ray Fluorescence determination of interfering elements rubidium and uranium by profile fitting

    Science.gov (United States)

    Dhara, Sangita; Khooha, Ajay; Singh, Ajit Kumar; Tiwari, M. K.; Misra, N. L.

    2018-06-01

    Systematic studies to assess the analytical parameters obtained in the total reflection X-ray fluorescence (TXRF) determinations of interfering elements Rb and U using profile fitting are reported in the present manuscript. The X-ray lines Rb Kα and U Lα having serious spectral interference (ΔE = 218 eV), have been used as analytical lines. The intensities of these X-ray lines have been assessed using profile fitting. In order to compare the analytical results of Rb determinations in presence of U, with and without U excitation, synchrotron radiation was tuned to energy just above and below the U Labs edge. This approach shall excite both Rb Kα and U Lα simultaneously and Rb Kα selectively. Finally, the samples were also analyzed with a laboratory based TXRF spectrometer. The analytical results obtained in all these conditions were comparable. The authenticity of the results was assessed by analyzing U with respect to Rb in Rb2U(SO4)3, a standard reference material for U. The average precision obtained for TXRF determinations was below 3% (RSD, n = 3, 1σ) and the percent deviation of TXRF values from the expected values calculated on the basis of sample preparation was within 3%.

  9. X-ray total reflection mirrors for coherent illumination

    CERN Document Server

    Ishikawa, T; Yabashi, M; Souvorov, A; Yamauchi, K; Yamamura, K; Mimura, H; Saito, A; Mori, Y

    2002-01-01

    X-ray mirrors for coherent illumination demand much higher surface quality than is achievable with the conventional polishing techniques. Plasma chemical vaporization machining (CVM) and elastic emission machining (EEM) have been applied for x-ray mirror manufacturing. Figure error of a flat silicon single crystal mirrors made with CVM+EEM process was reduced to 2.0 nm peak-to-valley and 0.2 nm RMS. The machining process was also applied to make elliptical mirrors. One-dimensional focusing with a single elliptical mirror showed diffraction-limited properties with the focal width of 200 nm. Two-dimensional focusing with Kirkpatric-Baez configuration gave a focal spot size of 200 nm x 200 nm. (author)

  10. Stellar X-Ray Polarimetry

    Science.gov (United States)

    Swank, J.

    2011-01-01

    Most of the stellar end-state black holes, pulsars, and white dwarfs that are X-ray sources should have polarized X-ray fluxes. The degree will depend on the relative contributions of the unresolved structures. Fluxes from accretion disks and accretion disk corona may be polarized by scattering. Beams and jets may have contributions of polarized emission in strong magnetic fields. The Gravity and Extreme Magnetism Small Explorer (GEMS) will study the effects on polarization of strong gravity of black holes and strong magnetism of neutron stars. Some part of the flux from compact stars accreting from companion stars has been reflected from the companion, its wind, or accretion streams. Polarization of this component is a potential tool for studying the structure of the gas in these binary systems. Polarization due to scattering can also be present in X-ray emission from white dwarf binaries and binary normal stars such as RS CVn stars and colliding wind sources like Eta Car. Normal late type stars may have polarized flux from coronal flares. But X-ray polarization sensitivity is not at the level needed for single early type stars.

  11. Synchrotron Radiation Total Reflection X-ray Fluorescence Spectroscopy for Microcontamination Analysis on Silicon Wafer Surfaces

    Energy Technology Data Exchange (ETDEWEB)

    Takaura, Norikatsu

    1997-10-01

    As dimensions in state-of-the-art CMOS devices shrink to less than 0.1 pm, even low levels of impurities on wafer surfaces can cause device degradation. Conventionally, metal contamination on wafer surfaces is measured using Total Reflection X-Ray Fluorescence Spectroscopy (TXRF). However, commercially available TXRF systems do not have the necessary sensitivity for measuring the lower levels of contamination required to develop new CMOS technologies. In an attempt to improve the sensitivity of TXRF, this research investigates Synchrotron Radiation TXRF (SR TXRF). The advantages of SR TXRF over conventional TXRF are higher incident photon flux, energy tunability, and linear polarization. We made use of these advantages to develop an optimized SR TXRF system at the Stanford Synchrotron Radiation Laboratory (SSRL). The results of measurements show that the Minimum Detection Limits (MDLs) of SR TXRF for 3-d transition metals are typically at a level-of 3x10{sup 8} atoms/cm{sup 2}, which is better than conventional TXRF by about a factor of 20. However, to use our SR TXRF system for practical applications, it was necessary to modify a commercially available Si (Li) detector which generates parasitic fluorescence signals. With the modified detector, we could achieve true MDLs of 3x10{sup 8} atoms/cm{sup 2} for 3-d transition metals. In addition, the analysis of Al on Si wafers is described. Al analysis is difficult because strong Si signals overlap the Al signals. In this work, the Si signals are greatly reduced by tuning the incident beam energy below the Si K edge. The results of our measurements show that the sensitivity for Al is limited by x-ray Raman scattering. Furthermore, we show the results of theoretical modeling of SR TXRF backgrounds consisting of the bremsstrahlung generated by photoelectrons, Compton scattering, and Raman scattering. To model these backgrounds, we extended conventional theoretical models by taking into account several aspects particular

  12. The capabilities of total reflection X-ray fluorescence in the polymeric analytical field*1

    Science.gov (United States)

    Vázquez, Cristina

    2004-08-01

    This paper presents the capabilities of total reflection X-ray fluorescence (TXRF) as analytical technique specially focused in high-viscosity polymer dispersions. Appropriate sample preparation procedures are described taking into account the time stability of these dispersions. Special remarks considering different ways for drying samples in order to obtain the most uniform deposited film are investigated focusing on the behavior of aqueous and viscous systems. Due to the difficulty found for obtaining a homogeneous mixture between sample and internal standard in such systems, the use of Compton incoherent scattering is discussed as an alternative procedure for trace quantification in high viscous systems without any mixing processes.

  13. A novel x-ray circularly polarized ranging method

    Science.gov (United States)

    Song, Shi-Bin; Xu, Lu-Ping; Zhang, Hua; Gao, Na; Shen, Yang-He

    2015-05-01

    Range measurement has found multiple applications in deep space missions. With more and further deep space exploration activities happening now and in the future, the requirement for range measurement has risen. In view of the future ranging requirement, a novel x-ray polarized ranging method based on the circular polarization modulation is proposed, termed as x-ray circularly polarized ranging (XCPolR). XCPolR utilizes the circular polarization modulation to process x-ray signals and the ranging information is conveyed by the circular polarization states. As the circular polarization states present good stability in space propagation and x-ray detectors have light weight and low power consumption, XCPolR shows great potential in the long-distance range measurement and provides an option for future deep space ranging. In this paper, we present a detailed illustration of XCPolR. Firstly, the structure of the polarized ranging system is described and the signal models in the ranging process are established mathematically. Then, the main factors that affect the ranging accuracy, including the Doppler effect, the differential demodulation, and the correlation error, are analyzed theoretically. Finally, numerical simulation is carried out to evaluate the performance of XCPolR. Projects supported by the National Natural Science Foundation of China (Grant Nos. 61172138 and 61401340), the Natural Science Basic Research Plan in Shaanxi Province of China (Grant No. 2013JQ8040), the Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20130203120004), the Open Research Fund of the Academy of Satellite Application, China (Grant No. 2014 CXJJ-DH 12), the Xi’an Science and Technology Plan, China (Grant No. CXY1350(4)), the Fundamental Research Funds for the Central Universities, China (Grant Nos. 201413B, 201412B, and JB141303), and the Open Fund of Key Laboratory of Precision Navigation and Timing Technology, National Time Service Center, Chinese

  14. Magnetic x-ray circular dichroism in spin-polarized photoelectron diffraction

    International Nuclear Information System (INIS)

    Waddill, G.D.; Tobin, J.G.

    1994-01-01

    The first structural determination with spin-polarized, energy-dependent photoelectron diffraction using circularly-polarized x-rays is reported for Fe films on Cu(001). Circularly-polarized x-rays produced spin-polarized photoelectrons from the Fe 2p doublet, and intensity asymmetries in the 2p 3/2 level are observed. Fully spin-specific multiple scattering calculations reproduced the experimentally-determined energy and angular dependences. A new analytical procedure which focuses upon intensity variations due to spin-dependent diffraction is introduced. A sensitivity to local geometric and magnetic structure is demonstrated

  15. Pigment particles analysis with a total reflection X-ray fluorescence spectrometer: study of influence of instrumental parameters

    Energy Technology Data Exchange (ETDEWEB)

    Coccato, Alessia; Vandenabeele, Peter [Ghent University, Department of Archaeology, Ghent (Belgium); Vekemans, Bart; Vincze, Laszlo; Moens, Luc [Ghent University, Department of Analytical Chemistry, Ghent (Belgium)

    2016-12-15

    Total reflection X-ray fluorescence (TXRF) analysis is an excellent tool to determine major, minor and trace elements in minuscule amounts of samples, making this technique very suitable for pigment analysis. Collecting minuscule amounts of pigment material from precious works of art by means of a cotton swab is a well-accepted sampling method, but poses specific challenges when TXRF is to be used for the characterization of the unknown material. (orig.)

  16. Polarized X-Ray Emission from Magnetized Neutron Stars: Signature of Strong-Field Vacuum Polarization

    Science.gov (United States)

    Lai, Dong; Ho, Wynn C.

    2003-08-01

    In the atmospheric plasma of a strongly magnetized neutron star, vacuum polarization can induce a Mikheyev-Smirnov-Wolfenstein type resonance across which an x-ray photon may (depending on its energy) convert from one mode into the other, with significant changes in opacities and polarizations. We show that this vacuum resonance effect gives rise to a unique energy-dependent polarization signature in the surface emission from neutron stars. The detection of polarized x rays from neutron stars can provide a direct probe of strong-field quantum electrodynamics and constrain the neutron star magnetic field and geometry.

  17. Polarized x-ray emission from magnetized neutron stars: signature of strong-field vacuum polarization.

    Science.gov (United States)

    Lai, Dong; Ho, Wynn C G

    2003-08-15

    In the atmospheric plasma of a strongly magnetized neutron star, vacuum polarization can induce a Mikheyev-Smirnov-Wolfenstein type resonance across which an x-ray photon may (depending on its energy) convert from one mode into the other, with significant changes in opacities and polarizations. We show that this vacuum resonance effect gives rise to a unique energy-dependent polarization signature in the surface emission from neutron stars. The detection of polarized x rays from neutron stars can provide a direct probe of strong-field quantum electrodynamics and constrain the neutron star magnetic field and geometry.

  18. Inorganic pigment study of the San Pedro Gonzalez Telmo Sibyls using total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Vazquez, Cristina; Custo, Graciela; Barrio, Nestor; Burucua, Jose; Boeykens, Susana; Marte, Fernando

    2010-01-01

    This article describes the study carried out on a series of oil paintings on canvas from the eighteenth century that were restored at Centro de Produccion e Investigacion en Restauracion y Conservacion Artistica y Bibliografica - Tarea (CEIRCAB-Tarea), Buenos Aires, Argentina: the San Pedro Gonzalez Telmo Sibyls. Experimental study was undertaken to identify inorganic pigments and the technique used in their confection; and, in this way, try to add information about their local origin. Therefore special emphasis was put to infer technologies used in the manufacturing of these paintings. Elemental analysis was performed by total reflection X-ray fluorescence spectrometry (TXRF) and complemented by optical and polarized light microscopy. Microsampling was carefully done over areas of the paintings which were damaged and where a small additional loss will not be noticed. This investigation has shown that a variety of pigments were used, namely earth pigments (red and yellow ochres), white lead, vermilion, etc., and they were used either pure or in mixtures. This characterization helped conservators in their decisions regarding a better understanding of the deterioration processes. In addition, this research about the material composition allowed the art historians and restorers the possibility to obtain information about where, when or by whom The San Pedro Gonzalez Telmo Sibyls may have been painted.

  19. Inorganic pigment study of the San Pedro Gonzalez Telmo Sibyls using total reflection X-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Vazquez, Cristina, E-mail: vazquez@cnea.gov.a [Universidad de Buenos Aires, Facultad de Ingenieria, Paseo Colon 850. C1063ACU, Buenos Aires (Argentina); Comision Nacional de Energia Atomica, Gerencia Quimica, Av. Gral Paz 1499, B1650KNA, San Martin (Argentina); Custo, Graciela, E-mail: custo@cnea.gov.a [Comision Nacional de Energia Atomica, Gerencia Quimica, Av. Gral Paz 1499, B1650KNA, San Martin (Argentina); Barrio, Nestor, E-mail: nbarrio@unsam.edu.a [CEIRCAB-TAREA, Universidad Nacional de San Martin (UNSAM), Escuela de Humanidades, Campus Miguelete, 25 de Mayo y Francia, B1650KNA, San Martin (Argentina); Burucua, Jose, E-mail: gburucua@unsam.edu.a [CEIRCAB-TAREA, Universidad Nacional de San Martin (UNSAM), Escuela de Humanidades, Campus Miguelete, 25 de Mayo y Francia, B1650KNA, San Martin (Argentina); Boeykens, Susana [Universidad de Buenos Aires, Facultad de Ingenieria, Paseo Colon 850. C1063ACU, Buenos Aires (Argentina); Marte, Fernando, E-mail: fmarte@unsam.edu.a [CEIRCAB-TAREA, Universidad Nacional de San Martin (UNSAM), Escuela de Humanidades, Campus Miguelete, 25 de Mayo y Francia, B1650KNA, San Martin (Argentina)

    2010-09-15

    This article describes the study carried out on a series of oil paintings on canvas from the eighteenth century that were restored at Centro de Produccion e Investigacion en Restauracion y Conservacion Artistica y Bibliografica - Tarea (CEIRCAB-Tarea), Buenos Aires, Argentina: the San Pedro Gonzalez Telmo Sibyls. Experimental study was undertaken to identify inorganic pigments and the technique used in their confection; and, in this way, try to add information about their local origin. Therefore special emphasis was put to infer technologies used in the manufacturing of these paintings. Elemental analysis was performed by total reflection X-ray fluorescence spectrometry (TXRF) and complemented by optical and polarized light microscopy. Microsampling was carefully done over areas of the paintings which were damaged and where a small additional loss will not be noticed. This investigation has shown that a variety of pigments were used, namely earth pigments (red and yellow ochres), white lead, vermilion, etc., and they were used either pure or in mixtures. This characterization helped conservators in their decisions regarding a better understanding of the deterioration processes. In addition, this research about the material composition allowed the art historians and restorers the possibility to obtain information about where, when or by whom The San Pedro Gonzalez Telmo Sibyls may have been painted.

  20. Matrix effect on the detection limit and accuracy in total reflection X-ray fluorescence analysis of trace elements in environmental and biological samples

    International Nuclear Information System (INIS)

    Karjou, J.

    2007-01-01

    The effect of matrix contents on the detection limit of total reflection X-ray fluorescence analysis was experimentally investigated using a set of multielement standard solutions (500 ng/mL of each element) in variable concentrations of NH 4 NO 3 . It was found that high matrix concentration, i.e. 0.1-10% NH 4 NO 3 , had a strong effect on the detection limits for all investigated elements, whereas no effect was observed at lower matrix concentration, i.e. 0-0.1% NH 4 NO 3 . The effect of soil and blood sample masses on the detection limit was also studied. The results showed decreasing the detection limit (in concentration unit, μg/g) with increasing the sample mass. However, the detection limit increased (in mass unit, ng) with increasing sample mass. The optimal blood sample mass of ca. 200 μg was sufficient to improve the detection limit of Se determination by total reflection X-ray fluorescence. The capability of total reflection X-ray fluorescence to analyze different kinds of samples was discussed with respect to the accuracy and detection limits based on certified and reference materials. Direct analysis of unknown water samples from several sources was also presented in this work

  1. Total reflection x-ray fluorescence spectrometers for multielemental analysis: status of commercial equipment

    International Nuclear Information System (INIS)

    Ayala Jimenez, R.E.

    2000-01-01

    Multi-elemental analysis by total reflection x-ray fluorescence spectrometry has evolved during two decades. At the present there are commercial equipment available for the chemical analysis in all kind of biological and mineral samples. The electronic industry has also been benefited from the scientific and technological developments in the field of TXRF. The basic components of the spectrometers can be summarized as follow: a) excitation source; b) geometric arrangement (optics) for collimation and monochromatization of the primary radiation; c) x-ray detector; d) hardware and software for operation of the instrument, data acquisition and spectral deconvolution to determine the concentrations of the element present in the sample (quantitative analysis). As optional there are manufacturers offering the conventional 45 degrees geometry for direct excitation of bulky liquid or solid samples. Personal communications of the author and the commercial brochures available at the moment of writing this presentation have allowed to list the following type of components used in the TXRF spectrometers for multi-elemental analysis (the devices used in the electronic industry to analyze silicon wafers are excluded). Excitation: high power x-ray tube, output from 1300 to 2000 watts; metal ceramic low power-ray tube, output up to 50 watts. Different anodes are used but molybdenum, tungsten and copper are frequent. The excitation systems can be customized according to the requirements of the laboratory. Detector: Si-Li semi-conductor liquid nitrogen cooled; silicon solid state thermoelectrically cooled (silicon drift detector SDD and Si-PIN diode). Optics: multilayer monochromator of Si-W or Ni-C; double multilayer monochromator. Electronics: spectroscopy amplifier, analog to digital converter adapted to a PC compatible computer with software in Windows environment for the whole operation of the spectrometer and for qualy/quantitative analysis of samples are standards in the

  2. Total reflection X-ray fluorescence analysis of airborne silver nanoparticles from fabrics.

    Science.gov (United States)

    Menzel, Magnus; Fittschen, Ursula Elisabeth Adriane

    2014-03-18

    Ag nanoparticles (NPs) are usually applied to consumer products because of their antimicrobial properties, which are desired in fabrics for sportswear as well as cloth used for cleaning. Hazards to human health from airborne Ag NPs may occur when the NPs are inhaled. NPs are comparable in size to macromolecules and viruses and able to penetrate deep into the lungs, e.g., the alveoli, where they may cause damage to cells and tissue due to their large surface area. In this study, aerosols released form fabrics treated with Ag NPs were collected using a low pressure Berner impactor and analyzed with total reflection X-ray fluorescence (TXRF). We found that the Ag NPs are released primarily in the form of larger particles, mainly 0.13-2 μm, probably attached to fiber material. Using an electron micro probe, single particles could be identified. The detection of backscattered electrons suggests small spots on the particle consist of a heavier element, which most likely is Ag, although the signal in energy-dispersive X-ray spectroscopy (EDX) was below the lower limit of detection (LOD). To achieve LODs necessary for Ag determination, Ar peaks were eliminated by a nitrogen atmosphere provided by the "Picofox-box". This enables linear calibration and quantification of Ag. The LOD was calculated at 0.2 ng (2.0 ppb). Following the TXRF and scanning electron microscopy (SEM)/EDX analysis, the aerosol samples were dissolved in nitric acid and analyzed with ICPMS to successfully confirm the results obtained by the TXRF measurements.

  3. Metals determination in coffee sample by total reflection X-ray fluorescence analysis (TXRF)

    International Nuclear Information System (INIS)

    Vives, Ana Elisa Sirito de

    2005-01-01

    The objective of this study was to evaluate the inorganic concentration in five brands of coffee, three of them nationally marketed and the others of an exportation kind. The samples were prepared by infusion with deionized water. To carry out the calibration, standard solutions were prepared with different concentrations of Al, Si, K, Ca, Ti, Cr, Fe, Ni, Zn and Se. The measurements were carried out using a white beam of synchrotron radiation for excitation and a Si (Li) semiconductor detector for detection. By employing Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF) it was possible to evaluate the concentrations of P, S, Cl, K, Ca, Mn, Fe, Cu, Zn, Rb and Ba. The detection limits for 300 s counting time were in the range of 0.03 (Ca) to 30 ng.g -1 (Rb), respectively. (author)

  4. Metals determination in coffee sample by total reflection X-ray fluorescence analysis (TXRF)

    Energy Technology Data Exchange (ETDEWEB)

    Vives, Ana Elisa Sirito de [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil). Faculdade de Engenharia, Arquitetura e Urbanismo]. E-mail: aesvives@unimep.br; Moreira, Silvana [Universidade Estadual de Campinas, SP (Brazil). Faculdade de Engenharia Civil, Arquitetura e Urbanismo]. E-mail: Silvana@fec.unicamp.br; Brienza, Sandra Maria Boscolo [ Universidade Metodista de Piracicaba (UNIMEP), Piracicaba, SP (Brazil). Faculdade de Ciencias Matematicas, da Natureza e de Tecnologia da Informacao]. E-mail: sbrienza@unimep.br; Zucchi, Orgheda Luiza Araujo Domingues [Sao Paulo Univ., Ribeirao Preto, SP (Brazil). Faculdade de Ciencias Farmaceuticas]. E-mail: olzucchi@fcfrp.usp.br; Nascimento Filho, Virgilio Franco do [Centro de Energia Nuclear na Agricultura (CENA), Piracicaba, SP (Brazil)]. E-mail: virgilio@cena.usp.br

    2005-07-01

    The objective of this study was to evaluate the inorganic concentration in five brands of coffee, three of them nationally marketed and the others of an exportation kind. The samples were prepared by infusion with deionized water. To carry out the calibration, standard solutions were prepared with different concentrations of Al, Si, K, Ca, Ti, Cr, Fe, Ni, Zn and Se. The measurements were carried out using a white beam of synchrotron radiation for excitation and a Si (Li) semiconductor detector for detection. By employing Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF) it was possible to evaluate the concentrations of P, S, Cl, K, Ca, Mn, Fe, Cu, Zn, Rb and Ba. The detection limits for 300 s counting time were in the range of 0.03 (Ca) to 30 ng.g{sup -1} (Rb), respectively. (author)

  5. X ray reflection masks: Manufacturing, characterization and first tests

    Science.gov (United States)

    Rahn, Stephen

    1992-09-01

    SXPL (Soft X-ray Projection Lithography) multilayer mirrors are characterized, laterally structured and then used as reflection masks in a projecting lithography procedure. Mo/Si-multilayer mirrors with a 2d in the region of 14 nm were characterized by Cu-k(alpha) grazing incidence as well as soft X-ray normal incidence reflectivity measurements. The multilayer mirrors were patterned by reactive ion etching with CF4 using a photoresist as etch mask, thus producing X-ray reflection masks. The masks were tested at the synchrotron radiation laboratory of the electron accelerator ELSA. A double crystal X-ray monochromator was modified so as to allow about 0.5 sq cm of the reflection mask to be illuminated by white synchrotron radiation. The reflected patterns were projected (with an energy of 100 eV) onto a resist and structure sizes down to 8 micrometers were nicely reproduced. Smaller structures were distorted by Fresnel-diffraction. The theoretically calculated diffraction images agree very well with the observed images.

  6. Fundamental quantification procedure for total reflection X-ray fluorescence spectra analysis and elements determination

    International Nuclear Information System (INIS)

    Wegrzynek, D.; Holynska, B.

    1997-01-01

    A method for the determination of the concentrations of elements in particulate-like samples measured in total reflection geometry is proposed. In the proposed method the fundamental parameters are utilized for calculating the sensitivities of elements and an internal standard is used to account for the unknown mass per unit area of a sample and geometrical constant of the spectrometer. The modification of the primary excitation spectrum on its way to a sample has been taken into consideration. The concentrations of the elements to be determined are calculated simultaneously with the spectra deconvolution procedure. In the process of quantitative analysis the intensities of all X-ray peaks corresponding to K and L-series lines present in the analyzed spectrum are taken into account. (Author)

  7. The role of total-reflection x-ray fluorescence in atomic spectroscopy

    International Nuclear Information System (INIS)

    Toelg, G.; Klockenkaemper, R.

    1993-01-01

    Total-reflection X-ray fluorescence (TXRF) is a universal and economic method for the simultaneous determination of elements with atomic numbers > 11 down to the lower pg-level. It is a microanalytical tool for the analysis of small sample amounts placed on flat carriers and for contaminations on flat sample surfaces. Analyses of stratified near-surface layers are made possible by varying the incident angle of the primary beam in the region of total-reflection. This non-destructive method is especially suitable for thin layers of a few nanometres, deposited on wafer material although not usable as a microprobe method with a high lateral resolution. Furthermore, depth profiles of biological samples can be recorded by means of microtome sectioning of only a few micrometres, as, for example in the gradient analysis of human organs. In addition to micro- and surface-layer analysis, TXRF is effectively applied to element trace analysis. Homogeneous solutions, for example aqueous solutions, high-purity acids or body fluids, are pipetted onto carriers and, after evaporation, the dry residues are analyzed directly down to the pg/ml region. Particularly advantageous is the absence of matrix effects, so that an easy calibration can be carried out by adding a single internal standard element. A digestion or separation step preceding the actual determination becomes necessary if a more complex matrix is to be analysed or especially low detection limits have to be reached. A critical evaluation of the recent developments in atomic spectroscopy places TXRF in a leading position. Its outstanding features compete with those of e.g. electrothermal atomic absorption spectrometry (ETAAS), microwave induced plasma optical emission spectroscopy (MIP-OES) and inductively coupled plasma mass spectrometry (ICP-MS) in the field of micro- and trace analysis and with Rutherford backscattering (RBS) and secondary ion mass spectrometry (SIMS) in the surface-layer analysis. (author)

  8. X-ray reflection in oxygen-rich accretion discs of ultracompact X-ray binaries

    DEFF Research Database (Denmark)

    Madej, O. K.; Garcia, Jeronimo; Jonker, P. G.

    2014-01-01

    We present spectroscopic X-ray data of two candidate ultracompact X-ray binaries (UCXBs): 4U 0614+091 and 4U 1543-624. We confirm the presence of a broad O viii Ly alpha reflection line (at a parts per thousand 18 angstrom) using XMM-Newton and Chandra observations obtained in 2012 and 2013. The ...

  9. Application of a portable total reflection x-ray fluorescence spectrometer to a trace elemental analysis of wines

    International Nuclear Information System (INIS)

    Kunimura, Shinsuke; Kawai, Jun

    2009-01-01

    A portable total reflection X-ray fluorescence (TXRF) spectrometer has been applied to a trace elemental analysis of wines. Sulfur, K, Mn, Fe, and Rb were detected. These five elements were quantified by using 1 ppm of Co as an internal standard. The quantified concentrations ranged from sub-ppm to several hundred ppm. Because of organic substances in wines, the scattering of the incident X-rays from the dry residues of wines becomes strong. Therefore, a high spectral background appears in TXRF spectra of wines. Because of this background, relative standard deviations of the quantified concentrations were from 4 to 28%. Although the high spectral background appeared in the TXRF spectra of the wines, a detection limit down to several tens of ppb was achieved. The present portable spectrometer can be applied to screening for trace elements in wines before an accurate and precise analysis using a large elemental analyzer. (author)

  10. Circular polarization control for the European XFEL in the soft X-ray regime

    Energy Technology Data Exchange (ETDEWEB)

    Geloni, Gianluca [European XFEL GmbH, Hamburg (Germany); Kocharyan, Vitali; Saldin, Evgeni [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)

    2011-06-15

    The possibility of producing X-ray radiation with high degree of circular polarization is an important asset at XFEL facilities. Polarization control is most important in the soft X-ray region.However, the baseline of the European XFEL, including the soft X-ray SASE3 line, foresees planar undulators only, yielding linearly-polarized radiation. It is clear that the lowest-risk strategy for implementing polarization control at SASE3 involves adding an APPLE II-type undulator at the end of the planar undulator, in order to exploit the micro bunching from the baseline FEL. Detailed experience is available in synchrotron radiation laboratories concerning the manufacturing of 5 m-long APPLE II undulators. However, the choice of a short helical radiator leads to the problem of background suppression. The driving idea of our proposal is that the background radiation can be suppressed by spatial filtering. This operation can be performed by inserting slits behind the APPLE II radiator, where the linearly-polarized radiation spot size is about 30 times larger than the radiation spot size from the helical radiator. The last 7 cells of the SASE3 undulator are left with an open gap in order to provide a total 42 m drift section for electron beam and radiation. Due to the presence of the drift the linearly-polarized radiation spot size increases, and the linearly polarized background radiation can be suppressed by the slits. At the same time, the microbunch structure is easily preserved, so that intense (100 GW) coherent radiation is emitted in the helical radiator. We propose a filtering setup consisting of a pair of water cooled slits for X-ray beam filtering and of a 5 m-long magnetic chicane, which creates an offset for slit installation immediately behind the helical radiator. Electrons and X-rays are separated before the slits by the magnetic chicane, so that the electron beam can pass by the filtering setup without perturbations. Based on start-to-end simulations we

  11. Circular polarization control for the European XFEL in the soft X-ray regime

    International Nuclear Information System (INIS)

    Geloni, Gianluca; Kocharyan, Vitali; Saldin, Evgeni

    2011-06-01

    The possibility of producing X-ray radiation with high degree of circular polarization is an important asset at XFEL facilities. Polarization control is most important in the soft X-ray region.However, the baseline of the European XFEL, including the soft X-ray SASE3 line, foresees planar undulators only, yielding linearly-polarized radiation. It is clear that the lowest-risk strategy for implementing polarization control at SASE3 involves adding an APPLE II-type undulator at the end of the planar undulator, in order to exploit the micro bunching from the baseline FEL. Detailed experience is available in synchrotron radiation laboratories concerning the manufacturing of 5 m-long APPLE II undulators. However, the choice of a short helical radiator leads to the problem of background suppression. The driving idea of our proposal is that the background radiation can be suppressed by spatial filtering. This operation can be performed by inserting slits behind the APPLE II radiator, where the linearly-polarized radiation spot size is about 30 times larger than the radiation spot size from the helical radiator. The last 7 cells of the SASE3 undulator are left with an open gap in order to provide a total 42 m drift section for electron beam and radiation. Due to the presence of the drift the linearly-polarized radiation spot size increases, and the linearly polarized background radiation can be suppressed by the slits. At the same time, the microbunch structure is easily preserved, so that intense (100 GW) coherent radiation is emitted in the helical radiator. We propose a filtering setup consisting of a pair of water cooled slits for X-ray beam filtering and of a 5 m-long magnetic chicane, which creates an offset for slit installation immediately behind the helical radiator. Electrons and X-rays are separated before the slits by the magnetic chicane, so that the electron beam can pass by the filtering setup without perturbations. Based on start-to-end simulations we

  12. RASOR: an advanced instrument for soft x-ray reflectivity and diffraction.

    Science.gov (United States)

    Beale, T A W; Hase, T P A; Iida, T; Endo, K; Steadman, P; Marshall, A R; Dhesi, S S; van der Laan, G; Hatton, P D

    2010-07-01

    We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument.

  13. Determination of solid surface composition by the X-ray fluorescence method under total external reflection with angular scanning

    International Nuclear Information System (INIS)

    Krasnolutskij, V.P.

    2000-01-01

    Possibilities of determination of composition of surface layers by X-ray fluorescence analysis under total reflection of incident radiation with angular scanning of a target are investigated. For the case of the GaAs target it is shown that the sensibility of this method is sufficient for a control of element composition in layer of thickness 1 nm. A simple method for solution of inverse task of analysis of a two component medium is considered [ru

  14. Quantitative determination of iron, copper, lead, chromium and nickel in electronic waste samples using total reflection x-ray fluorescence spectroscopy

    International Nuclear Information System (INIS)

    Elaseer, A. S.; Musbah, A. S; Ammar, M. M. G.; Salah, M. A.; Aisha, E. A.

    2015-01-01

    Total reflection x-ray fluorescence spectroscopy in conjunction with microwave assisted extraction technique was used for the analysis of twenty electronic waste samples. The analysis was limited to the printed circuit boards of electronic devices. Iron, copper, lead, chromium and nickel were quantitatively determined in the samples. The samples were carefully milled to fine powder and 50mg was digested by acid using microwave digestion procedure. The digested samples solution was spread together with gallium as internal standard on the reflection disk and analyzed. The results showed that the cassette recorder boards contain the highest concentration of iron, lead and nickel. The average concentrations of these metals were 78, 73 and 71g/Kg respectively. Computer boards contained the highest copper average concentration 39g/Kg. the highest chromium average concentration 3.6 g/Kg was in mobile phone boards. Measurements were made using PicoTAX portable x-ray device. the instrument was used for quantitative multi-element analysis. An air cooled x-ray tube (40KV, 1 mA) with Mo target and Be window was used as x-ray source. The optics of the device was a multilayer Ni/C, 17.5 keV, 80% reflectivity provides analysis of elements from Si to Zr (K series) and Rh to U (L series). A Si PIN-diode detector (7mm"2, 195eV) was used for the elements detection. In this study heavy metals average concentration in electronic circuit boards in the in the order of iron (35.25g/kg), copper (21.14g/Kg), lead (16.59g/Kg), nickel (16.01g/Kg) and chromium (1.07g/Kg).(author)

  15. Impact of a Vertically Polarized Undulator on LCLS Hard X-ray Experiments

    Energy Technology Data Exchange (ETDEWEB)

    Fritz, David [SLAC National Accelerator Lab., Menlo Park, CA (United States)

    2014-11-14

    The LCLS-II project will install two variable gap, horizontally polarized undulators into the LCLS undulator hall. One undulator is designed to produce soft x-rays spanning an energy range of 200-1250 eV (SXU) while the other is designed for the hard spectral range of 1-25 keV (HXU). The hard x-ray LCLS instruments (X-ray Pump- Probe [XPP], X-ray correlation Spectroscopy [XCS], Coherent X-ray Imaging [CXI], Matter in Extreme Conditions [MEC]) will be repurposed to operate on the HXU line while two new soft x-ray beamlines will be created for the SXU line. An alternate HXU undulator design is being considered that could provide advantages over the present design choice. In particular, the project team is collaborating with Argonne National Laboratory to develop a vertically polarized undulator (VPU). A 1-m prototype VPU device was successfully constructed this year and a full size prototype is in process. A decision to alter the project baseline, which is the construction of a horizontally polarized device, must be made in the coming weeks to not impact the present project schedule. Please note that a change to the soft x-ray undulator is not under discussion at the moment.

  16. Analytical characterization of artists' pigments used in old and modern paintings by total-reflection x-ray fluorescence

    International Nuclear Information System (INIS)

    Klockenkaemper, R.; Bohlen, A. von; Moens, L.; Devos, W.

    1993-01-01

    The analytical characterization of artists' pigments is a most helpful tool for art history, conservation and restoration of paintings. A very gentle method of ultra-microsampling was developed that is especially applicable to paintings under restoration. It provides a sample mass of about 1 μg and is virtually non-destructive. This minute amount is sufficient for total-reflection X-ray fluorescence (TXRF) to determine most of those elements building inorganic pigments. The convenient and fast method was applied to oil paintings. Various pigments were identified and their mixing proportion was determined even quantitatively. (author)

  17. Final Report - X-ray Studies of Highly Correlated Systems

    Energy Technology Data Exchange (ETDEWEB)

    Burns, Clement [Western Michigan Univ., Kalamazoo MI (United States)

    2017-11-27

    The overall goal of the research was to improve the capabilities of x-ray synchrotron instrumentation to enable cutting-edge research in condensed matter physics. The main goal of the current grant cycle was to find a method to measure the polarization of the scattered x-ray in resonant inelastic x-ray scattering. To do this, we developed a polarization analysis apparatus using a thin, toroidally bent single crystal, which could be set to reflect one or the other of the two polarization components in the scattered x-ray beam. Resonant x-ray scattering measurements were also carried out on interfaces and the charge density wave in high temperature superconducting materials.

  18. Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering

    Energy Technology Data Exchange (ETDEWEB)

    Gao, Xuan [Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States); Key Laboratory of Multi-scale Manufacturing Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714 (China); Casa, Diego; Kim, Jungho; Gog, Thomas [Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States); Li, Chengyang [Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States); Department of Physics, South University of Science and Technology of China, Shenzhen 518055 (China); Burns, Clement [Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252 (United States)

    2016-08-15

    Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals.

  19. X-ray specular reflection and fluorescence study of nano-films

    International Nuclear Information System (INIS)

    Zheludeva, S.; Novikova, N.

    2001-01-01

    The techniques that combine the advantages of high-resolution structure sensitive x-ray methods with spectroscopic selectivity of data obtained are shown to be extremely promising for characterization of organic and inorganic nano films and nano structures. Fluorescence yield angular dependences exited by complicated evanescent wave / x-ray standing wave pattern at total reflection and glancing incidence can be used to detect structure position of different ions in organic systems and alien interfacial layers in inorganic multilayers;, to get information about interdiffusion at the interfaces of Langmuir- Blodgett (L-B) films and artificial inorganic - x-ray mirrors; to study ion permeation through L-B nano structures - models of biomembrans; to obtain nano - film thickness and density; to get precisely the parameters of small d-space multilayer mirrors, ets

  20. Total reflection X-ray fluorescence as a tool for food screening

    Science.gov (United States)

    Borgese, Laura; Bilo, Fabjola; Dalipi, Rogerta; Bontempi, Elza; Depero, Laura E.

    2015-11-01

    This review provides a comprehensive overview of the applications of total reflection X-ray fluorescence (TXRF) in the field of food analysis. Elemental composition of food is of great importance, since food is the main source of essential, major and trace elements for animals and humans. Some potentially toxic elements, dangerous for human health may contaminate food, entering the food chain from the environment, processing, and storage. For this reason the elemental analysis of food is fundamental for safety assessment. Fast and sensitive analytical techniques, able to detect major and trace elements, are required as a result of the increasing demand on multi-elemental information and product screening. TXRF is suitable for elemental analysis of food, since it provides simultaneous multi-elemental identification in a wide dynamic range of concentrations. Several different matrices may be analyzed obtaining results with a good precision and accuracy. In this review, the most recent literature about the use of TXRF for the analysis of food is reported. The focus is placed on the applications within food quality monitoring of drinks, beverages, vegetables, fruits, cereals, animal derivatives and dietary supplements. Furthermore, this paper provides a critical outlook on the developments required to transfer these methods from research to the industrial and analytical laboratories contexts.

  1. Investigation of polyelectrolytes by total reflection x-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Varga, I.; Nagy, M.

    2000-01-01

    Water soluble polyelectrolyte samples containing mono-, bi- and trivalent metal ions were investigated without any pretreatment. Acid digestion of linear polymers may lead to a product insoluble in water so the digestion has to be avoided. The aim of this paper was the determination of analytical characteristics and limitations of the total reflection x-ray fluorescence (TXRF) analysis for poly (vinylalcohol-vinylsulphate) salts and poly (acrylic acid, acrylamide) copolymers containing the following cations: K + , Cs + , Ba 2+ , Cu 2+ and La 3+ . On the basis of our results efficiency of ion-exchange during preparation of polyelectrolytes and stoichiometry of the end-product were determined. TXRF results were compared with data gained by inductively coupled plasma atomic emission spectrometry (ICP-AES) measurements except in the case of Cs + which has poor sensitivity in ICP-AES. Good agreement was found between the results of the two techniques and calculations from titrimetric data. Concentration of Li + and Mg 2+ in polymer samples was measured by ICP-AES. In majority of cases film-like dry residues of aqueous solutions of polyelectrolytes can be characterized by homogeneous spatial distribution of metal ions within the organic matrix. This is because the migration of the ions is hindered during drying process. Determination of metals in polyelectrolyte films by TXRF is quite ideal as model for analysis of plant, animal or human tissues which is a frequent task in environmental and inorganic biomedical analytical chemistry. (author)

  2. Characterization of a microfocused circularly polarized x-ray probe

    International Nuclear Information System (INIS)

    Pollmann, J.; Srajer, G.; Maser, J.; Lang, J. C.; Nelson, C. S.; Venkataraman, C. T.; Isaacs, E. D.

    2000-01-01

    We report on the development of a circularly polarized x-ray microprobe in the intermediate energy range from 5 to 10 keV. In this experiment linearly polarized synchrotron radiation was circularly polarized by means of a Bragg-diffracting diamond phase retarder and subsequently focused down to a spot size of about 4x2 μm 2 by a Fresnel zone plate. The properties of the microprobe were characterized, and the technique was applied to the two-dimensional mapping of magnetic domains in HoFe 2 . (c) 2000 American Institute of Physics

  3. Multielemental analysis in Brazilian cigarettes using total reflection X-ray fluorescence with synchrotron radiation

    International Nuclear Information System (INIS)

    Serpa, Renata F.B.; Jesus, Edgar F.O. de; Lopes, Ricardo T.; Moreira, Silvana

    2005-01-01

    In order to identify major and trace elements in conventional and light Brazilian cigarettes, Total Reflection X-Ray Fluorescence with Synchrotron Radiation (SR-TXRF) was used. The fluorescence measurements were carried out at Brazilian Synchrotron Light Laboratory, Campinas - Sao Paulo. This technique enables detection limit is in the ngg -1 range, which is very useful in elemental tobacco smoke analysis, since it presents most of its elements at a trace level. The major elements identified in tobacco samples were: S, Cl, K, Ca, Mn, Fe and Cd, and the trace elements were: Ti, Cr, Ni, Cu, Zn, Br, Rb, Sr and Ba. However in tobacco smoke samples, there were only two major elements: K and Ca, the others were present a trace level. The rate transfer of tobacco to tobacco smoke was about 2.5 % for all elements studied. (author)

  4. Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids

    Energy Technology Data Exchange (ETDEWEB)

    Eckert, S., E-mail: sebastian.eckert@helmholtz-berlin.de, E-mail: martin.beye@helmholtz-berlin.de; Beye, M., E-mail: sebastian.eckert@helmholtz-berlin.de, E-mail: martin.beye@helmholtz-berlin.de; Pietzsch, A.; Quevedo, W.; Hantschmann, M. [Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin (Germany); Ochmann, M.; Huse, N. [Institute for Nanostructure and Solid State Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany and Max Planck Institute for the Structure and Dynamics of Matter, Center for Free-Electron Laser Science, Luruper Chaussee 149, 22761 Hamburg (Germany); Ross, M.; Khalil, M. [Department of Chemistry, University of Washington, Box 351700, Seattle, Washington 98195 (United States); Minitti, M. P.; Turner, J. J.; Moeller, S. P.; Schlotter, W. F.; Dakovski, G. L. [LCLS, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Föhlisch, A. [Institute for Methods and Instrumentation in Synchrotron Radiation Research, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein-Str. 15, 12489 Berlin (Germany); Institut für Physik und Astronomie, Universität Potsdam, Karl-Liebknecht-Str. 24/25, 14476 Potsdam (Germany)

    2015-02-09

    The discovery of ultrafast X-ray induced optical reflectivity changes enabled the development of X-ray/optical cross correlation techniques at X-ray free electron lasers worldwide. We have now linked through experiment and theory the fundamental excitation and relaxation steps with the transient optical properties in finite solid samples. Therefore, we gain a thorough interpretation and an optimized detection scheme of X-ray induced changes to the refractive index and the X-ray/optical cross correlation response.

  5. Bragg transmission phase plates for the production of circularly polarized x-rays

    International Nuclear Information System (INIS)

    Lang, J.C.; Srajer, G.

    1994-01-01

    A thin-crystal Si (400) Bragg transmission x-ray phase plate has been constructed for the production of 5 to 12 keV circularly polarized x-rays. Using multiple beam diffraction from a GaAs crystal, a direct measurement of the degree of circular polarization as a function of off-Bragg position was made. These measurements indicated nearly complete circular polarization (|P c | ≥ 0.95) and full helicity reversal on opposite sides of the rocking curve

  6. Calibrating an ellipsometer using x-ray reflectivity

    International Nuclear Information System (INIS)

    Richter, Andrew; Guico, Rodney; Wang, Jin

    2001-01-01

    X-ray reflectivity has been used to find the optical refractive index of polymer thin film in order to calibrate a Stokes ellipsometer for film thickness measurements during the deposition procedure. A thin, spun-cast film of poly(tert-butyl acrylate) (PtBA) was made with a film thickness of ∼500 {angstrom}. An x-ray reflectivity measurement was taken and the data were fit to determine the thickness of the PtBA film and the underlying silicon--oxide layer. This measurement was then used to calculate the optical refractive index for PtBA at the ellipsometer wavelength. Using this value for the refractive index subsequently allowed us to determine the film thickness for a series of PtBA films made by using a number of polymer solution concentrations resulting in film thickness ranging from 100 to 1300 {angstrom}. These film thicknesses were found to be generally the same as those found using x-ray reflectivity. The success of this procedure suggests a useful method for calibrating an ellipsometer for fast in-lab measurements, especially on ultrathin films when simultaneous determination of the film thickness and the refractive index is less reliable

  7. A method for thickness determination of thin films of amalgamable metals by total-reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Bennun, L.; Greaves, E.D.; Barros, H.; Diaz-Valdes, J.

    2009-01-01

    A method for thickness determination of thin amalgamable metallic films by total-reflection X-ray fluorescence (TXRF) is presented. The peak's intensity in TXRF spectra are directly related to the surface density of the sample, i.e. to its thickness in a homogeneous film. Performing a traditional TXRF analysis on a thin film of an amalgamated metal, and determining the relative peak intensity of a specific metal line, the layer thickness can be precisely obtained. In the case of gold thickness determination, mercury and gold peaks overlap, hence we have developed a general data processing scheme to achieve the most precise results.

  8. First Total Reflection X-Ray Fluorescence round-robin test of water samples: Preliminary results

    Energy Technology Data Exchange (ETDEWEB)

    Borgese, Laura; Bilo, Fabjola [Chemistry for Technologies Laboratory, University of Brescia, Brescia (Italy); Tsuji, Kouichi [Graduate School of Engineering, Osaka City University, Osaka (Japan); Fernández-Ruiz, Ramón [Servicio Interdepartamental de Investigación (SIdI), Laboratorio de TXRF, Universidad Autónoma de Madrid, Madrid (Spain); Margui, Eva [Department of Chemistry, University of Girona, Girona (Spain); Streli, Christina [TU Wien, Atominstitut,Radiation Physics, Vienna (Austria); Pepponi, Giancarlo [Fondazione Bruno Kessler, Povo, Trento (Italy); Stosnach, Hagen [Bruker Nano GmbH, Berlin (Germany); Yamada, Takashi [Rigaku Corporation, Takatsuki, Osaka (Japan); Vandenabeele, Peter [Department of Archaeology, Ghent University, Ghent (Belgium); Maina, David M.; Gatari, Michael [Institute of Nuclear Science and Technology, University of Nairobi, Nairobi (Kenya); Shepherd, Keith D.; Towett, Erick K. [World Agroforestry Centre (ICRAF), Nairobi (Kenya); Bennun, Leonardo [Laboratorio de Física Aplicada, Departamento de Física, Universidad de Concepción (Chile); Custo, Graciela; Vasquez, Cristina [Gerencia Química, Laboratorio B025, Centro Atómico Constituyentes, San Martín (Argentina); Depero, Laura E., E-mail: laura.depero@unibs.it [Chemistry for Technologies Laboratory, University of Brescia, Brescia (Italy)

    2014-11-01

    Total Reflection X-Ray Fluorescence (TXRF) is a mature technique to evaluate quantitatively the elemental composition of liquid samples deposited on clean and well polished reflectors. In this paper the results of the first worldwide TXRF round-robin test of water samples, involving 18 laboratories in 10 countries are presented and discussed. The test was performed within the framework of the VAMAS project, interlaboratory comparison of TXRF spectroscopy for environmental analysis, whose aim is to develop guidelines and a standard methodology for biological and environmental analysis by means of the TXRF analytical technique. - Highlights: • The discussion of the first worldwide TXRF round-robin test of water samples (18 laboratories of 10 countries) is reported. • Drinking, waste, and desalinated water samples were tested. • Data dispersion sources were identified: sample concentration, preparation, fitting procedure, and quantification. • The protocol for TXRF analysis of drinking water is proposed.

  9. Trace elemental analysis of leaching solutions of hijiki seaweeds by a portable total reflection X-ray fluorescence spectrometer

    International Nuclear Information System (INIS)

    Liu, Ying; Imashuku, Susumu; Kawai, Jun

    2014-01-01

    A portable total reflection X-ray fluorescence spectrometer (TXRF) was used to analyze leaching solutions of hijiki seaweeds. S, Cl, K, Ca, Ti, Fe, Ni, As and Br were detected in the solutions. Arsenic quantification results were compared to those from ICP-AES. The TXRF quantification results of arsenic were not significantly different from those of ICP-AES, as two-way analysis of variance (ANOVA) method was applied to the significance test. This kind of small and high sensitive TXRF spectrometer can be used in food quality and environmental pollution investigation. (author)

  10. Top layer's thickness dependence on total electron-yield X-ray standing-wave

    International Nuclear Information System (INIS)

    Ejima, Takeo; Yamazaki, Atsushi; Banse, Takanori; Hatano, Tadashi

    2005-01-01

    A Mo single-layer film with a stepwise thickness distribution was fabricated on the same Mo/Si reflection multilayer film. Total electron-yield X-ray standing-wave (TEY-XSW) spectra of the aperiodic multilayer were measured with reflection spectra. The peak positions of the standing waves in the TEY-XSW spectra changed as the film thickness of the top Mo-layer increased

  11. Metal ions diffusion through polymeric matrices: A total reflection X-ray fluorescence study

    International Nuclear Information System (INIS)

    Boeykens, S.; Caracciolo, N.; D'Angelo, M.V.; Vazquez, C.

    2006-01-01

    This work proposes the use of X-ray fluorescence with total reflection geometry to explore the metal ions transport in aqueous hydrophilic polymer solutions. It is centered in the study of polymer concentration influence on ion diffusion. This subject is relevant to various and diverse applications, such as drug controlled release, microbiologic corrosion protection and enhanced oil recovery. It is anticipated that diffusion is influenced by various factors in these systems, including those specific to the diffusing species, such as charge, shape, molecular size, and those related to the structural complexity of the matrix as well as any specific interaction between the diffusing species and the matrix. The diffusion of nitrate salts of Ba and Mn (same charge, different hydrodynamic radii) through water-swollen polymeric solutions and gels in the 0.01% to 1% concentration ranges was investigated. The measurements of the metal concentration were performed by TXRF analysis using the scattered radiation by the sample as internal standard. Results are discussed according to different physical models for solute diffusion in polymeric solutions

  12. Vacuum birefringence and the x-ray polarization from black-hole accretion disks

    Science.gov (United States)

    Caiazzo, Ilaria; Heyl, Jeremy

    2018-04-01

    In the next decade, x-ray polarimetry will open a new window on the high-energy Universe, as several missions that include an x-ray polarimeter are currently under development. Observations of the polarization of x rays coming from the accretion disks of stellar-mass and supermassive black holes are among the new polarimeters' major objectives. In this paper, we show that these observations can be affected by the quantum electrodynamic (QED) effect of vacuum birefringence: after an x-ray photon is emitted from the accretion disk, its polarization changes as the photon travels through the accretion disk's magnetosphere, as a result of the vacuum becoming birefringent in the presence of a magnetic field. We show that this effect can be important for black holes in the energy band of the upcoming polarimeters and has to be taken into account in a complete model of the x-ray polarization that we expect to detect from black-hole accretion disks, both for stellar mass and for supermassive black holes. We find that, for a chaotic magnetic field in the disk, QED can significantly decrease the linear polarization fraction of edge-on photons, depending on the spin of the hole and on the strength of the magnetic field. This effect can provide, for the first time, a direct way to probe the magnetic field strength close to the innermost stable orbit of black-hole accretion disks and to study the role of magnetic fields in astrophysical accretion in general.

  13. Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence

    Science.gov (United States)

    Wu, Meiyi; Burcklen, Catherine; André, Jean-Michel; Guen, Karine Le; Giglia, Angelo; Koshmak, Konstantin; Nannarone, Stefano; Bridou, Françoise; Meltchakov, Evgueni; Rossi, Sébastien de; Delmotte, Franck; Jonnard, Philippe

    2017-11-01

    We study Cr/Sc-based multilayer mirrors designed to work in the water window range using hard and soft x-ray reflectivity as well as x-ray fluorescence enhanced by standing waves. Samples differ by the elemental composition of the stack, the thickness of each layer, and the order of deposition. This paper mainly consists of two parts. In the first part, the optical performances of different Cr/Sc-based multilayers are reported, and in the second part, we extend further the characterization of the structural parameters of the multilayers, which can be extracted by comparing the experimental data with simulations. The methodology is detailed in the case of Cr/B4C/Sc sample for which a three-layer model is used. Structural parameters determined by fitting reflectivity curve are then introduced as fixed parameters to plot the x-ray standing wave curve, to compare with the experiment, and confirm the determined structure of the stack.

  14. Total-reflection X-ray fluorescence: An alternative tool for the analysis of magnetic ferrofluids

    Energy Technology Data Exchange (ETDEWEB)

    Fernandez-Ruiz, R. [Servicio Interdepartamental de Investigacion (SIdI), Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco, E-28049, Madrid (Spain)], E-mail: ramon.fernandez@uam.es; Costo, R.; Morales, M.P.; Bomati-Miguel, O.; Veintemillas-Verdaguer, S. [Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049, Madrid (Spain)

    2008-12-15

    This work presents the first application of the total-reflection X-ray fluorescence (TXRF) to the compositional study of magnetic ferrofluids. With the aims of validating the best analytical conditions and also, limitations of the TXRF in the compositional study of these materials, an alternative empirical method, based in the use of angle-dependence TXRF (AD-TXRF) measurements, is proposed. Three kinds of ferromagnetic nanoparticles, with different morphologies, have been studied. The techniques of inductively coupled plasma mass spectrometry (ICP-MS) and inductively coupled plasma optical emission spectroscopy (ICP-OES) have been used to validate the TXRF results. In contrast with the plasma techniques, the developed TXRF procedure need not of previous chemical acid digestion. Additionally, two procedures of magnetic nanoparticles synthesis, co-precipitation and laser-pyrolysis, have been checked for the contaminants trace metals Zn, Mn and Cr. It has been found that the method of laser-pyrolysis produces nanoparticles of higher purity.

  15. Design Concept of Superconducting Multipole Wiggler with Variably Polarized X-Ray

    International Nuclear Information System (INIS)

    Hwang, C.S.; Chang, C.H.; Li, W.P.; Lin, F.Y.

    2004-01-01

    In response to the growing demand for X-ray research, and to satisfy future needs for generating circularly polarized synchrotron radiation in the X-ray region, a 3.5 T superconducting multipole with a periodic length of 6 cm was designed to produce horizontal linearly polarized, and circularly polarized light on a 1.5 GeV electron storage ring. Differently arranged excitation current loop for the same coil design switched between the operation of symmetric and asymmetric modes to creat the linearly and circularly polarized light, respectively. This study elucidates the design concepts of the superconducting multipole wiggler with symmetric and asymmetric operation modes. The design of the magnetic circuit and the field calculation are also discussed. Meanwhile, the spectra characteristics of the symmetric and asymmetric modes are calculated and presented in this article

  16. Multielement determination in river-water of Sepetiba Bay tributaries (Brazil) by total reflection X-ray fluorescence using synchrotron radiation

    International Nuclear Information System (INIS)

    Costa, A.C.M.; Castro, C.R.F.; Lopes, R.T.; Anjos, M.J.; Rio de Janeiro State Univ.

    2006-01-01

    Trace elements were determined in the surface waters of tributaries of the Sepetiba Bay, Brazil (Piraque, Ita, Sao Francisco, Guarda, Guandu Mirim, Vala do Sangue and Engenho Novo rivers) by total reflection X-ray fluorescence using synchrotron radiation (SRTXRF). Eighteen trace elements could be determined in the dissolved and the suspended particulate phases: Al, Si, P, S, Cl, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr and Pb. The elemental concentration values were compared to the values recommended by the Brazilian legislation. (author)

  17. Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    International Nuclear Information System (INIS)

    Bhattacharya, Debarati; Basu, Saibal; Singh, Surendra; Roy, Sumalay; Dev, Bhupendra Nath

    2012-01-01

    Highlights: ► Room temperature diffusion in Si/Ni/Si trilayer detected through complementary x-ray and polarized neutron reflectometry. ► Analyses of XPNR data generated the construction of the layered structure in terms of physical parameters along with alloy layers created by diffusion. ► Scattering length density information from XPNR provided quantitative assessment of the stoichiometry of alloys formed at the Si/Ni and Ni/Si interfaces. - Abstract: Interdiffusion occurring across the interfaces in a Si/Ni/Si layered system during deposition at room temperature was probed using x-ray reflectivity (XRR) and polarized neutron reflectivity (PNR). Exploiting the complementarity of these techniques, both structural and magnetic characterization with nanometer depth resolution could be achieved. Suitable model fitting of the reflectivity profiles identified the formation of Ni–Si mixed alloy layers at the Si/Ni and Ni/Si interfaces. The physical parameters of the layered structure, including quantitative assessment of the stoichiometry of interfacial alloys, were obtained from the analyses of XRR and PNR patterns. In addition, PNR provided magnetic moment density profile as a function of depth in the stratified medium.

  18. Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    Energy Technology Data Exchange (ETDEWEB)

    Bhattacharya, Debarati, E-mail: debarati@barc.gov.in [Solid State Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India); Basu, Saibal; Singh, Surendra [Solid State Physics Division, Bhabha Atomic Research Centre, Trombay, Mumbai 400085 (India); Roy, Sumalay; Dev, Bhupendra Nath [Department of Materials Science, Indian Association for the Cultivation of Science, 2A and 2B Raja S.C. Mullick Road, Jadavpur, Kolkata 700032 (India)

    2012-12-15

    Highlights: Black-Right-Pointing-Pointer Room temperature diffusion in Si/Ni/Si trilayer detected through complementary x-ray and polarized neutron reflectometry. Black-Right-Pointing-Pointer Analyses of XPNR data generated the construction of the layered structure in terms of physical parameters along with alloy layers created by diffusion. Black-Right-Pointing-Pointer Scattering length density information from XPNR provided quantitative assessment of the stoichiometry of alloys formed at the Si/Ni and Ni/Si interfaces. - Abstract: Interdiffusion occurring across the interfaces in a Si/Ni/Si layered system during deposition at room temperature was probed using x-ray reflectivity (XRR) and polarized neutron reflectivity (PNR). Exploiting the complementarity of these techniques, both structural and magnetic characterization with nanometer depth resolution could be achieved. Suitable model fitting of the reflectivity profiles identified the formation of Ni-Si mixed alloy layers at the Si/Ni and Ni/Si interfaces. The physical parameters of the layered structure, including quantitative assessment of the stoichiometry of interfacial alloys, were obtained from the analyses of XRR and PNR patterns. In addition, PNR provided magnetic moment density profile as a function of depth in the stratified medium.

  19. X-ray diffraction study of KTP (KTiOPO4) crystals under a static electric field

    International Nuclear Information System (INIS)

    Sebastian, M.T.; Klapper, H.; Bolt, R.J.

    1992-01-01

    X-ray diffraction studies are made on ion-conducting potassium titanyl phosphate (KTP) crystals with in situ DC electric field along different crystallographic directions. The X-ray rocking curves recorded with an electric field along the polar b axis (which is the direction of ion conduction) show a strong enhancement of the 040 reflection intensity (reflecting planes normal to the b axis) whereas the h0l reflections (reflecting planes parallel to the polar axis) do not show any intensity change. For an electric field normal to the polar axis no intensity change, either in 040 or in h0l reflections occurs. This observation is supplemented by X-ray topography. The 040 X-ray topographs recorded with in situ electric field along b exhibit strong extinction contrast in the form of striations parallel to the polar (ion-conduction) axis. The 040 intensity increase and the striation contrast are attributed to lattice deformation by the space-charge polarization due to the movement of the K + ions under the influence of the electric field. (orig.)

  20. Characterization and classification of spirituous beverages by total reflection x-ray fluorescence

    International Nuclear Information System (INIS)

    Davila, E.G. de; Lue-Meru, M.P.; Capote, T.; Greaves, E.

    2000-01-01

    The total reflection x-ray fluorescence (TXRF) technique was applied for the multi-elemental analysis of spirituous beverages like rum, cocuy (typical spirituous beverage in Venezuela), whiskey and wine, in order to classify the samples by product processing and geographical origin by chemometric analysis. Special attention was paid to the cocuy samples, since there is a lack of quality control of this beverage, mainly due to the home-made product processing. The use of the Compton peak information was evaluated for the determination of organic content in samples. In the specifically case of cocuy samples the Compton peak area was correlated to the ash content for detection of adulteration with sugar syrup. Cocuy samples were also analyzed using gas chromatography, for pH, acidity, ash content and refractometry, in order to develop the recognition pattern. The TXRF analysis was carried out in a Canberra spectrometer, using the K α-line of a Motube, by a direct procedure previously developed. The analysis of the data was done by using principal components analysis and a confidence test. The results show that TXRF and chemometric analysis is a useful tool for quality control of spirituous beverages, not only concerning to metal content, but also in the evaluation of sugar and non volatile organic content. (author)

  1. Characterization and classification of spirituous beverages by total reflection x-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Davila, E.G. de [Univerisdad Centroccidental Lisandro Alvarado, Decanato de Agronomia, Dpto. de Quimica y Suelos. Nucleo Tarabana, cabudare, Edo. Lara (Venezuela); Lue-Meru, M P; Capote, T [Univerisdad Centroccidental Lisandro Alvarado, Decanato de Agronomia, Dpto. de Quimica y Suelos. Nucleo Tarabana, Cabudare, Edo. Lara (Venezuela); Universidad Simon Bolivar, Dpto. de Quimica, Lab. Espectroscopia Atomica, Sartenejas, Baruta, Edo. Miranda (Venezuela); Greaves, E [Universidad Simon Bolivar, Dpto. de Fisica, Sartenejas, Baruta, Edo. Miranda (Venezuela)

    2000-07-01

    The total reflection x-ray fluorescence (TXRF) technique was applied for the multi-elemental analysis of spirituous beverages like rum, cocuy (typical spirituous beverage in Venezuela), whiskey and wine, in order to classify the samples by product processing and geographical origin by chemometric analysis. Special attention was paid to the cocuy samples, since there is a lack of quality control of this beverage, mainly due to the home-made product processing. The use of the Compton peak information was evaluated for the determination of organic content in samples. In the specifically case of cocuy samples the Compton peak area was correlated to the ash content for detection of adulteration with sugar syrup. Cocuy samples were also analyzed using gas chromatography, for pH, acidity, ash content and refractometry, in order to develop the recognition pattern. The TXRF analysis was carried out in a Canberra spectrometer, using the K {alpha}-line of a Motube, by a direct procedure previously developed. The analysis of the data was done by using principal components analysis and a confidence test. The results show that TXRF and chemometric analysis is a useful tool for quality control of spirituous beverages, not only concerning to metal content, but also in the evaluation of sugar and non volatile organic content. (author)

  2. Total reflection X-ray fluorescence analysis of river waters in its stream across the city of Cordoba, in Argentina

    International Nuclear Information System (INIS)

    Valentinuzzi, M.C.; Sanchez, H.J.; Abraham, J.

    2006-01-01

    The aim of this work was to analyze the composition of river waters and to study their quality by detecting possible contaminants. The samples were taken at 32 points of the Suquia River in its stream across the city of Cordoba (in the Province of Cordoba, Argentina). The samples were analyzed with total reflection X-ray fluorescence (TXRF) using beam guides. Beam guides made of two Si plate reflectors were used as sample carriers and to guide the X-ray photons to the sample; the measurements were taken using the characteristic configuration that ensures the best excitation and detection conditions (in TXRF). The analyses were carried out by preconcentration of the water samples and by adding an internal standard (Gallium); small amounts of samples (30 μl) were deposited on the Si reflector plate and they were then analyzed in the total reflection regime. Spectra were analyzed with standard methods using conventional programs. The results show interesting behaviors of the concentration of trace elements along the river: elements of low atomic number (such as Ca, Cl, S, K) present higher concentrations as compared to high Z elements (such as Fe, Zn, Br, Sr); the concentrations of light elements follow a similar behavior along the stream, the same situation is observed in the set of elements with high atomic number. Some samples present high concentrations in certain elements indicating possible sources of contamination

  3. Polarized Gamma-Ray Emission from the Galactic Black Hole Cygnus X-1

    Science.gov (United States)

    Laurent, P.; Rodriquez, J.; Wilms, J.; Bel, M. Cadolle; Pottschmidt, K.; Grinberg, V.

    2011-01-01

    Because of their inherently high flux allowing the detection of clear signals, black hole X-ray binaries are interesting candidates for polarization studies, even if no polarization signals have been observed from them before. Such measurements would provide further detailed insight into these sources' emission mechanisms. We measured the polarization of the gamma-ray emission from the black hole binary system Cygnus X-I with the INTEGRAL/IBIS telescope. Spectral modeling ofthe data reveals two emission mechanisms: The 250-400 keY data are consistent with emission dominated by Compton scattering on thermal electrons and are weakly polarized. The second spectral component seen in the 400keV-2MeV band is by contrast strongly polarized, revealing that the MeV emission is probably related to the jet first detected in the radio band.

  4. Fish samples as bioindicator of environmental quality: synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF)

    International Nuclear Information System (INIS)

    Vives, Ana Elisa Sirito de; Moreira, Silvana; Brienza, Sandra Maria Boscolo; Zucchi, Orgheda Luiza Araujo Domingues; Nascimento Filho, Virgilio Franco do Centro de Energia Nuclear na Agricultura , Piracicaba, SP; Brazil)

    2005-01-01

    In this study fish were used as bioindicators of environmental contamination. The species were collected in Piracicaba River, Sao Paulo state, Brazil and the toxic elements concentrations were determined in muscle tissue and viscus (liver, intestine and stomach) by Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF). Were determined the elements Ti, Cr, Mn, Fe, Ni, Cu, Zn and Ba. The results were compared with values established by Brazilian Legislation for general food. The elements concentrations evidenced potential risk to human health and environmental quality alteration of the studied area. The measurements were realized at the 'Laboratorio Nacional de Luz Sincrotron' (LNLS) located in Campinas, Sao Paulo State, Brazil. (author)

  5. Determination of mercury in seawater by total reflection x-ray fluorescence spectrometry after an electrochemical preconcentration method

    International Nuclear Information System (INIS)

    Ritschel, A.; Chinea Cano, E.; Wobrauschek, P.; Kuntner, C.; Durakbasa, M.N.

    2000-01-01

    A new combined method of electrodeposition of trace elements on metallic plates with subsequent total-reflection x-ray fluorescence spectrometry (TXRF) is proposed for the determination of trace metals in natural waters. The elements of interest are electroplated on highly polished niobium discs which are used as sample carriers for the TXRF measurement. The electrochemical preconcentration is performed in a flow cell under a controlled working electrode potential. The preconcentration step involves only very little manipulation which minimizes the risk of contamination of the sample. The method was investigated by analyzing inorganic mercury in sea water. A detection limit of 7 ngl -1 could be achieved for mercury in a 40 ml sea water sample. (author)

  6. Fish samples as bioindicator of environmental quality: synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF)

    Energy Technology Data Exchange (ETDEWEB)

    Vives, Ana Elisa Sirito de [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil). Faculdade de Engenharia, Arquitetura e Urbanismo]. E-mail: aesvives@unimep.br; Moreira, Silvana [Universidade Estadual de Campinas, SP (Brazil). Faculdade de Engenharia, Arquitetura e Urbanismo]. E-mail: Silvana@fec.unicamp.br; Brienza, Sandra Maria Boscolo [Universidade Metodista de Piracicaba (UNIMEP), SP (Brazil). Faculdade de Ciencias Matematicas, da Natureza e de Tecnologia da Informacao]. E-mail: sbrienza@unimep.br; Zucchi, Orgheda Luiza Araujo Domingues [Sao Paulo Univ., Ribeirao Preto, SP (Brazil). Faculdade de Ciencias Farmaceuticas]. E-mail: olzucchi@fcfrp.usp.br; Nascimento Filho, Virgilio Franco do [Centro de Energia Nuclear na Agricultura (CENA), Piracicaba, SP (Brazil)]. E-mail: virgilio@cena.usp.br

    2005-07-01

    In this study fish were used as bioindicators of environmental contamination. The species were collected in Piracicaba River, Sao Paulo state, Brazil and the toxic elements concentrations were determined in muscle tissue and viscus (liver, intestine and stomach) by Synchrotron Radiation Total Reflection X-Ray Fluorescence Analysis (SR-TXRF). Were determined the elements Ti, Cr, Mn, Fe, Ni, Cu, Zn and Ba. The results were compared with values established by Brazilian Legislation for general food. The elements concentrations evidenced potential risk to human health and environmental quality alteration of the studied area. The measurements were realized at the 'Laboratorio Nacional de Luz Sincrotron' (LNLS) located in Campinas, Sao Paulo State, Brazil. (author)

  7. Dosimetry of x-rays from high-temperature plasmas

    International Nuclear Information System (INIS)

    Yamamoto, Takayoshi; Abe, Nobuyuki; Kawanishi, Masaharu

    1980-01-01

    Study on the dosimetry of ionizing radiations, especially of X-rays, emitted from high-temperature plasms has been made. As to the unpolarized Bremsstrahlung, a brief method to estimate electron temperatures with TLD is described and evaluation of average energy and current of the run-away electrons in the turbulent heating Tokamak is made by observing the half-value layer of the emitted X-rays and the total exposure per one shot of the Tokamak discharge. As to the polarized one, it is shown that the anisotropic electron temperature is related to the degree of polarization of the X-rays. Furthermore, reference is made to the possibility of developing such X-ray generators as can emit nearly monochromatic X-rays (characteristic X-rays) or polarized ones arbitrarily. (author)

  8. Resonant magnetic scattering of polarized soft x rays

    Energy Technology Data Exchange (ETDEWEB)

    Sacchi, M. [Centre Universitaire Paris-Sud, Orsay (France); Hague, C.F. [Universite Pierre et Marie Curie, Paris (France); Gullikson, E.M.; Underwood, J. [Ernest Orlando Lawrence Berkeley National Lab., CA (United States)

    1997-04-01

    Magnetic effects on X-ray scattering (Bragg diffraction, specular reflectivity or diffuse scattering) are a well known phenomenon, and they also represent a powerful tool for investigating magnetic materials since it was shown that they are strongly enhanced when the photon energy is tuned across an absorption edge (resonant process). The resonant enhancement of the magnetic scattering has mainly been investigated at high photon energies, in order to match the Bragg law for the typical lattice spacings of crystals. In the soft X-ray range, even larger effects are expected, working for instance at the 2p edges of transition metals of the first row or at the 3d edges of rare earths (300-1500 eV), but the corresponding long wavelengths prevent the use of single crystals. Two approaches have been recently adopted in this energy range: (i) the study of the Bragg diffraction from artificial structures of appropriate 2d spacing; (ii) the analysis of the specular reflectivity, which contains analogous information but has no constraints related to the lattice spacing. Both approaches have their own specific advantages: for instance, working under Bragg conditions provides information about the (magnetic) periodicity in ordered structures, while resonant reflectivity can easily be related to electronic properties and absorption spectra. An important aspect common to all the resonant X-ray scattering techniques is the element selectivity inherent to the fact of working at a specific absorption edge: under these conditions, X-ray scattering becomes in fact a spectroscopy. Results are presented for films of iron and cobalt.

  9. Determination of copper, iron and zinc in spirituous beverages by total reflection X-ray fluorescence spectrometry

    Science.gov (United States)

    Capote, T.; Marcó, L. M.; Alvarado, J.; Greaves, E. D.

    1999-10-01

    The concentration of copper in traditional homemade alcoholic distillates produced in Venezuela (Cocuy de Penca) were determined by total reflection X-ray fluorescence (TXRF) using vanadium as internal standard. The results were compared to those obtained by flame atomic absorption spectrometry (FAAS). Three preparative methods of addition of vanadium were compared: classical internal standard addition, 'layer on layer' internal standard addition and in situ addition of internal standard. The TXRF procedures were accurate and the precision was comparable to that obtained by the FAAS technique. Copper levels were above the maximum allowed limits for similar beverages. Zinc and iron in commercial and homemade distilled beverages were also analyzed by TXRF with in situ addition of internal standard demonstrating the usefulness of this technique for trace metal determination in distillates.

  10. Determination of lead in clay enameled by X-ray fluorescence technique in Total reflection and by Scanning Electron Microscopy; Determinacion de plomo en esmaltado de barro por Fluorescencia de rayos X en reflexion total y Microscopia Electronica de Barrido

    Energy Technology Data Exchange (ETDEWEB)

    Zarazua O, G.; Carapia M, L. [Instituto Nacional de Investigaciones Nucleares, C.P. 52045 Estado de Mexico (Mexico)

    2000-07-01

    This work has the objective of determining lead free in the glazed commercial stewing pans using the X-ray fluorescence technique in Total reflection (FRX) and the observation and semiquantitative determination of lead by Analytical Scanning Electron Microscopy (ASEM). (Author)

  11. Contribution of parsec-scale material onto the polarized X-ray spectrum of type-1 Seyfert galaxies

    Science.gov (United States)

    Marin, F.; Dovčiak, M.; Kammoun, E. S.

    2018-04-01

    Type-1 radio-quiet active galactic nuclei (AGN) are seen from the polar direction and offer a direct view of their central X-ray engine. If most of X-ray photons have traveled from the primary source to the observer with minimum light-matter interaction, a fraction of radiation is emitted at different directions and is reprocessed by the parsec-scale equatorial circumnuclear region or the polar outflows. It is still unclear how much the polarization expected from type-1 AGN is affected by radiation that have scattered on the distant AGN components. In this paper, we examine the contribution of remote material onto the polarized X-ray spectrum of type-1 Seyfert galaxies using radiative transfer Monte Carlo codes. We find that the observed X-ray polarization strongly depends on the initial polarization emerging from the disk-corona system. For unpolarized and parallelly polarized photons (parallel to the disk), the contribution is negligible below 3 keV and tends to increase the polarization degree by up to one percentage points at higher energies, smoothing out the energy-dependent variations of the polarization angle. For perpendicularly polarized corona photons, the addition of the circumnuclear scattered (parallel) component adds to the polarization above 10keV, decreases polarization below 10 keV and shifts the expected 90° rotation of the polarization angle to lower energies. In conclusion, we found that simulations of Seyfert-1s that do not account for reprocessing on the parsec-scale equatorial and polar material are under- or over-estimating the X-ray polarization by 0.1 - 1 percentage points.

  12. Observation of X-ray shadings in synchrotron radiation-total reflection X-ray fluorescence using a color X-ray camera

    Energy Technology Data Exchange (ETDEWEB)

    Fittschen, Ursula Elisabeth Adriane, E-mail: ursula.fittschen@chemie.uni-hamburg.de [Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Menzel, Magnus [Institut für Anorganische und Angewandte Chemie, Universität Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Scharf, Oliver [IfG Institute for Scientific Instruments GmbH, Berlin (Germany); Radtke, Martin; Reinholz, Uwe; Buzanich, Günther [BAM Federal Institute of Materials Research and Testing, Berlin (Germany); Lopez, Velma M.; McIntosh, Kathryn [Los Alamos National Laboratory, Los Alamos, NM (United States); Streli, Christina [Atominstitut, TU Wien, Vienna (Austria); Havrilla, George Joseph [Los Alamos National Laboratory, Los Alamos, NM (United States)

    2014-09-01

    Absorption effects and the impact of specimen shape on TXRF analysis has been discussed intensively. Model calculations indicated that ring shaped specimens should give better results in terms of higher counts per mass signals than filled rectangle or circle shaped specimens. One major reason for the difference in signal is shading effects. Full field micro-XRF with a color X-ray camera (CXC) was used to investigate shading, which occurs when working with small angles of excitation as in TXRF. The device allows monitoring the illuminated parts of the sample and the shaded parts at the same time. It is expected that sample material hit first by the primary beam shade material behind it. Using the CXC shading could be directly visualized for the high concentration specimens. In order to compare the experimental results with calculation of the shading effect the generation of controlled specimens is crucial. This was achieved by “drop on demand” technology. It allows generating uniform, microscopic deposits of elements. The experimentally measured shadings match well with those expected from calculation. - Highlights: • Use of a color X-ray camera and drop on demand printing to diagnose X-ray shading • Specimens were obtained uniform and well-defined in shape and concentration by printing. • Direct visualization and determination of shading in such specimens using the camera.

  13. Observation of X-ray shadings in synchrotron radiation-total reflection X-ray fluorescence using a color X-ray camera

    International Nuclear Information System (INIS)

    Fittschen, Ursula Elisabeth Adriane; Menzel, Magnus; Scharf, Oliver; Radtke, Martin; Reinholz, Uwe; Buzanich, Günther; Lopez, Velma M.; McIntosh, Kathryn; Streli, Christina; Havrilla, George Joseph

    2014-01-01

    Absorption effects and the impact of specimen shape on TXRF analysis has been discussed intensively. Model calculations indicated that ring shaped specimens should give better results in terms of higher counts per mass signals than filled rectangle or circle shaped specimens. One major reason for the difference in signal is shading effects. Full field micro-XRF with a color X-ray camera (CXC) was used to investigate shading, which occurs when working with small angles of excitation as in TXRF. The device allows monitoring the illuminated parts of the sample and the shaded parts at the same time. It is expected that sample material hit first by the primary beam shade material behind it. Using the CXC shading could be directly visualized for the high concentration specimens. In order to compare the experimental results with calculation of the shading effect the generation of controlled specimens is crucial. This was achieved by “drop on demand” technology. It allows generating uniform, microscopic deposits of elements. The experimentally measured shadings match well with those expected from calculation. - Highlights: • Use of a color X-ray camera and drop on demand printing to diagnose X-ray shading • Specimens were obtained uniform and well-defined in shape and concentration by printing. • Direct visualization and determination of shading in such specimens using the camera

  14. On the tunneling of full-vector X-Waves through a slab under frustrated total reflection condition

    KAUST Repository

    Salem, Mohamed; Bagci, Hakan

    2012-01-01

    Tunneling of full-vector X-Waves through a dielectric slab under frustrated total reflection condition is investigated. Full-vector X-Waves are obtained by superimposing transverse electric and magnetic polarization components, which are derived from the scalar X-Wave solution. The analysis of reflection and transmission at the dielectric interfaces is carried out analytically in a straightforward fashion using vector Bessel beam expansion. Investigation of the fields propagating away from the farther end of the slab (transmitted fields) shows an advanced (superluminal) transmission of the X-Wave peak. Additionally, a similar advanced reflection is also observed. The apparent tunneling of the peak is shown to be due to the phase shift in the fields' spectra and not to be causally related to the incident peak. © 2012 IEEE.

  15. On the tunneling of full-vector X-Waves through a slab under frustrated total reflection condition

    KAUST Repository

    Salem, Mohamed

    2012-07-01

    Tunneling of full-vector X-Waves through a dielectric slab under frustrated total reflection condition is investigated. Full-vector X-Waves are obtained by superimposing transverse electric and magnetic polarization components, which are derived from the scalar X-Wave solution. The analysis of reflection and transmission at the dielectric interfaces is carried out analytically in a straightforward fashion using vector Bessel beam expansion. Investigation of the fields propagating away from the farther end of the slab (transmitted fields) shows an advanced (superluminal) transmission of the X-Wave peak. Additionally, a similar advanced reflection is also observed. The apparent tunneling of the peak is shown to be due to the phase shift in the fields\\' spectra and not to be causally related to the incident peak. © 2012 IEEE.

  16. Optical and x-ray alignment approaches for off-plane reflection gratings

    Science.gov (United States)

    Allured, Ryan; Donovan, Benjamin D.; DeRoo, Casey T.; Marlowe, Hannah R.; McEntaffer, Randall L.; Tutt, James H.; Cheimets, Peter N.; Hertz, Edward; Smith, Randall K.; Burwitz, Vadim; Hartner, Gisela; Menz, Benedikt

    2015-09-01

    Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.

  17. Elemental concentration in normal skin and fibroepithelial polip lesions by synchrotron radiation total reflection X-ray fluorescence technique

    International Nuclear Information System (INIS)

    Soares, Julio C.A.C.R.; Canellas, Catarine G.L.; Lopes, Ricardo T.; Anjos, Marcelino J.

    2011-01-01

    In this work, the concentrations of trace elements were measured in acrochordon, a skin lesion also known as skin tag or fibroepithelial polyp, as well as in normal skin from the same patient. The samples were analysed by Synchrotron Radiation Total Reflection X- ray Fluorescence (SRTXRF) in the Synchrotron Light National Laboratory (LNLS) in Campinas/Sao Paulo-Brazil. The collection of lesion and healthy skin samples, including papillary dermis and epidermis, has involved 17 patients. It was evaluated the presence of P, S, Cl, K, Ca, Cr, Mn, Fe, Cu, Zn, Br and Rb in the paired samples, which were compared, and significant differences were found in some of them. (author)

  18. Radiation parameters of the x-ray binary A 0535 + 26 = HDE 245770 based on polarization and photometric data

    International Nuclear Information System (INIS)

    Larionov, V.M.

    1988-01-01

    Analysis of the observations of Shakhovskaya et al. has led to the identification in the radiation of the x-ray binary system A 0535 + 26 = HDE 245770 of two components associated with an optical 09 III star and an accretion disk around a neutron star. The parameters of the interstellar polarization agree with Serkowski's formula and the observations of neighboring stars. The variability of the brightness of the system observed in the optical and infrared ranges can be explained by changes in the contribution of the accretion disk to the total emission of the system. The values obtained for the parameters of the intrinsic polarization, interpreted in the framework of the proposed model, suggest directions of the polarization vectors in the infrared and x-ray range

  19. Monitoring environmental pollution of trace elements in tree-rings by synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF)

    International Nuclear Information System (INIS)

    Moreira, Silvana; Vives, Ana Elisa S. de; Brienza, Sandra Maria B.; Medeiros, Jean Gabriel S.; Tomazello Filho, Mario; Zucchi, Orgheda L.A.D.; Nascimento Filho, Virgilio F.

    2005-01-01

    This paper aims to study the environmental pollution in the tree development, as a manner to evaluate its use as bioindicator in urban and country sides. The sample collecting was carry out in Piracicaba city, Sao Paulo State, that presents high level of environmental contamination of the water, soil and air, due industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. It was selected the Caesalpinia peltophoroides ('Sibipiruna') specie because its very used in urban arborization. It was employed the analytical technique named total reflection X-ray fluorescence (TXRF) to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was done in the Brazilian Synchrotron Light Laboratory, using a white beam for excitation and a Si(Li) detector for characteristic X-ray detection. It was quantified the P, K, Ca, Ti, Fe, Sr, Ba e Pb elements. (author)

  20. Generation of linearly polarized resonant transition radiation X-ray beam

    International Nuclear Information System (INIS)

    Yajima, Kazuaki; Awata, Takaaki; Ikeda, Mitsuharu; Ikeda, Kenichi; Yogo, Akifumi; Itoh, Akio; Imanishi, Nobutsugu

    2000-01-01

    We have proposed a method to generate almost linearly polarized resonant transition radiation X rays by using a rectangular slit placed on an electron beam axis. Our calculation predicted that the linearity is 93.5% for the resonant transition radiation X-ray beam extracted through a slit of 0.5 mrad long and 0.2 mrad wide in case of 1-GeV electron beam irradiating a 7.5-μm thick Kapton foil stack. (author)

  1. Generation of linearly polarized resonant transition radiation X-ray beam

    Energy Technology Data Exchange (ETDEWEB)

    Yajima, Kazuaki; Awata, Takaaki; Ikeda, Mitsuharu; Ikeda, Kenichi; Yogo, Akifumi; Itoh, Akio; Imanishi, Nobutsugu [Kyoto Univ. (Japan). Dept. of Nuclear Engineering

    2000-03-01

    We have proposed a method to generate almost linearly polarized resonant transition radiation X rays by using a rectangular slit placed on an electron beam axis. Our calculation predicted that the linearity is 93.5% for the resonant transition radiation X-ray beam extracted through a slit of 0.5 mrad long and 0.2 mrad wide in case of 1-GeV electron beam irradiating a 7.5-{mu}m thick Kapton foil stack. (author)

  2. POLAR: A Space-borne X-Ray Polarimeter for Transient Sources

    Science.gov (United States)

    Orsi, S.; Polar Collaboration

    2011-02-01

    POLAR is a novel compact Compton X-ray polarimeter designed to measure the linear polarization of the prompt emission of Gamma Ray Bursts (GRB) and other strong transient sources such as soft gamma repeaters and solar flares in the energy range 50-500 keV. A detailed measurement of the polarization from astrophysical sources will lead to a better understanding of the source geometry and emission mechanisms. POLAR is expected to observe every year several GRBs with a minimum detectable polarization smaller than 10%, thanks to its large modulation factor, effective area, and field of view. POLAR consists of 1600 low-Z plastic scintillator bars, divided in 25 independent modular units, each read out by one flat-panel multi-anode photomultiplier. The design of POLAR is reviewed, and results of tests of one modular unit of the engineering and qualification model (EQM) of POLAR with synchrotron radiation are presented. After construction and testing of the full EQM, we will start building the flight model in 2011, in view of the launch foreseen in 2013.

  3. Rotation of X-ray polarization in the glitches of a silicon crystal monochromator.

    Science.gov (United States)

    Sutter, John P; Boada, Roberto; Bowron, Daniel T; Stepanov, Sergey A; Díaz-Moreno, Sofía

    2016-08-01

    EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the 'glitches' produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specific crystal orientations. If incorrectly compensated, they degrade the spectroscopic data. Normalization of the fluorescence signal by the incident flux alone is sometimes insufficient to compensate for the glitches. Measurements performed at the state-of-the-art wiggler beamline I20-scanning at Diamond Light Source have shown that the glitches alter the spatial distribution of the sample's quasi-elastic X-ray scattering. Because glitches result from additional Bragg reflections, multiple-beam dynamical diffraction theory is necessary to understand their effects. Here, the glitches of the Si(111) four-bounce monochromator of I20-scanning just above the Ni  K edge are associated with their Bragg reflections. A fitting procedure that treats coherent and Compton scattering is developed and applied to a sample of an extremely dilute (100 micromolal) aqueous solution of Ni(NO 3 ) 2 . The depolarization of the wiggler X-ray beam out of the electron orbit is modeled. The fits achieve good agreement with the sample's quasi-elastic scattering with just a few parameters. The X-ray polarization is rotated up to ±4.3° within the glitches, as predicted by dynamical diffraction. These results will help users normalize EXAFS data at glitches.

  4. Analysis of total and dissolved heavy metals in surface water of a Mexican polluted river by total reflection X-ray fluorescence spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Zarazua, G. [Instituto Nacional de Investigaciones Nucleares, Gerencia de Ciencias Ambientales, Apartado Postal 18-1027, Mexico D.F., C.P. 11801 (Mexico)]. E-mail: gzo@nuclear.inin.mx; Avila-Perez, P. [Instituto Nacional de Investigaciones Nucleares, Gerencia de Ciencias Ambientales, Apartado Postal 18-1027, Mexico D.F., C.P. 11801 (Mexico); Tejeda, S. [Instituto Nacional de Investigaciones Nucleares, Gerencia de Ciencias Ambientales, Apartado Postal 18-1027, Mexico D.F., C.P. 11801 (Mexico); Barcelo-Quintal, I. [Universidad Autonoma Metropolitana, Unidad Azcapotzalco, Mexico, D.F. (Mexico); Martinez, T. [Universidad Nacional Autonoma de Mexico, Facultad de Quimica, Mexico, D.F. (Mexico)

    2006-11-15

    The present area of study is located in the Upper Course of the Lerma River (UCLR). The Lerma is one of the most important rivers of Mexico, where it drains highly populated and industrialized regions. The aim of the present study is to determine the heavy metal concentration of Cr, Mn, Fe, Cu and Pb in dissolved and total phases of the UCLR by means of Total Reflection X-ray Fluorescence Spectrometry (TXRF). The surface water samples were collected at 8 sites distributed following the stream flow direction of the river. Four sampling campaigns were carried out in each site in a 1-year period. A sample preparation method was applied in order to obtain the total and dissolved fraction and to destroy the organic matter. The total heavy metal average concentration decrease in the following order: Fe (2566 {mu}g/L) > Mn (300 {mu}g/L) > Cu (66 {mu}g/L) > Cr (21 {mu}g/L) > Pb (15 {mu}g/L). In general, the heavy metal concentrations in water of the UCLR are below the maximum permissible limits.

  5. Analysis of total and dissolved heavy metals in surface water of a Mexican polluted river by total reflection X-ray fluorescence spectrometry

    Science.gov (United States)

    Zarazua, G.; Ávila-Pérez, P.; Tejeda, S.; Barcelo-Quintal, I.; Martínez, T.

    2006-11-01

    The present area of study is located in the Upper Course of the Lerma River (UCLR). The Lerma is one of the most important rivers of Mexico, where it drains highly populated and industrialized regions. The aim of the present study is to determine the heavy metal concentration of Cr, Mn, Fe, Cu and Pb in dissolved and total phases of the UCLR by means of Total Reflection X-ray Fluorescence Spectrometry (TXRF). The surface water samples were collected at 8 sites distributed following the stream flow direction of the river. Four sampling campaigns were carried out in each site in a 1-year period. A sample preparation method was applied in order to obtain the total and dissolved fraction and to destroy the organic matter. The total heavy metal average concentration decrease in the following order: Fe (2566 μg/L) > Mn (300 μg/L) > Cu (66 μg/L) > Cr (21 μg/L) > Pb (15 μg/L). In general, the heavy metal concentrations in water of the UCLR are below the maximum permissible limits.

  6. Analysis of total and dissolved heavy metals in surface water of a Mexican polluted river by total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Zarazua, G.; Avila-Perez, P.; Tejeda, S.; Barcelo-Quintal, I.; Martinez, T.

    2006-01-01

    The present area of study is located in the Upper Course of the Lerma River (UCLR). The Lerma is one of the most important rivers of Mexico, where it drains highly populated and industrialized regions. The aim of the present study is to determine the heavy metal concentration of Cr, Mn, Fe, Cu and Pb in dissolved and total phases of the UCLR by means of Total Reflection X-ray Fluorescence Spectrometry (TXRF). The surface water samples were collected at 8 sites distributed following the stream flow direction of the river. Four sampling campaigns were carried out in each site in a 1-year period. A sample preparation method was applied in order to obtain the total and dissolved fraction and to destroy the organic matter. The total heavy metal average concentration decrease in the following order: Fe (2566 μg/L) > Mn (300 μg/L) > Cu (66 μg/L) > Cr (21 μg/L) > Pb (15 μg/L). In general, the heavy metal concentrations in water of the UCLR are below the maximum permissible limits

  7. X-ray polarimetry with the Polarization Spectroscopic Telescope Array (PolSTAR)

    DEFF Research Database (Denmark)

    Krawczynski, Henric S.; Stern, Daniel; Harrison, Fiona A.

    2016-01-01

    This paper describes the Polarization Spectroscopic Telescope Array (PolSTAR), a mission proposed to NASA's 2014 Small Explorer (SMEX) announcement of opportunity. PolSTAR measures the linear polarization of 3-50 keV (requirement; goal: 2.5-70 keV) X-rays probing the behavior of matter,radiation ...

  8. New structural studies of liquid crystal by reflectivity and resonant X-ray diffraction; Nouvelles etudes structurales de cristaux liquides par reflectivite et diffraction resonante des rayons X

    Energy Technology Data Exchange (ETDEWEB)

    Fernandes, P

    2007-04-15

    This memory presents three structural studies of smectic Liquid Crystals by reflectivity and resonant diffraction of X-rays. It is divided in five chapters. In the first a short introduction to Liquid Crystals is given. In particular, the smectic phases that are the object of this study are presented. The second chapter is consecrated to the X-ray experimental techniques that were used in this work. The three last chapters present the works on which this thesis can be divided. Chapter three demonstrates on free-standing films of MHPOBC (historic liquid crystal that possesses the antiferroelectric sub-phases) the possibility to extend the technique of resonant X-ray diffraction to liquid crystals without resonant element. In the fourth chapter the structure of the B{sub 2} liquid crystal phase of bent-core molecules (or banana molecules) is elucidated by using resonant X-ray diffraction combined with polarization analysis of the diffracted beam. A model of the polarization of the resonant beam diffracted by four different structures proposed for the B{sub 2} phase is developed in this chapter. In the fifth chapter a smectic binary mixture presenting a very original critical point of phase separation is studied by X-ray reflectivity and optical microscopy. A concentration gradient in the direction perpendicular to the plane of the film seems to be induced by the free-standing film geometry. The results of a simplified model of the system are compatible with this interpretation.

  9. Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF 'state-of-the-art'

    Science.gov (United States)

    Pahlke, S.; Fabry, L.; Kotz, L.; Mantler, C.; Ehmann, T.

    2001-11-01

    In a well balanced system of highly motivated, well trained personnel and automated equipment, pure reagents and bulk media, cleanrooms and integrated data management, total-reflection X-ray fluorescence (TXRF) can and must contribute to quality assurance and process stability, support and canalize creative engineering by continuous learning about materials and processes. TXRF has the advantage of controlled one-point calibration, a linear dynamic range of three orders of magnitude, high grade of automation in operation and data management, high up-time, and a simple control of data plausibility.

  10. Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Sirito de Vives, Ana Elisa [School of Civil Engineering, Architecture and Urban Design Methodist University of Piracicaba, Rodovia Santa Barbara D' Oeste/Iracemapolis, km 01, 13450-000 Santa Barbara D' Oeste, SP (Brazil)]. E-mail: aesvives@unimep.br; Moreira, Silvana [State University of Campinas - UNICAMP/FEC (Brazil); Brienza, Sandra Maria Boscolo [School of Civil Engineering, Architecture and Urban Design Methodist University of Piracicaba, Rodovia Santa Barbara D' Oeste/Iracemapolis, km 01, 13450-000 Santa Barbara D' Oeste, SP (Brazil); Silva Medeiros, Jean Gabriel [University of Sao Paulo - USP/ ESALQ (Brazil); Tomazello Filho, Mario Tomazello [University of Sao Paulo - USP/ ESALQ (Brazil); Araujo Domingues Zucchi, Orgheda Luiza [University of Sao Paulo - USP/FCFRP (Brazil); Nascimento Filho, Virgilio Franco do [University of Sao Paulo - USP/CENA (Brazil)

    2006-11-15

    This paper aims to study the environmental pollution in the tree development, in order to evaluate its use as bioindicator in urban and country sides. The sample collection was carried out in Piracicaba city, Sao Paulo State, which presents high level of environmental contamination in water, soil and air, due to industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. The species Caesalpinia peltophoroides ('Sibipiruna') was selected because it is widely used in urban forestation. Synchrotron Radiation Total Reflection X-ray Fluorescence technique (SR-TXRF) was employed to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was performed in the Brazilian Synchrotron Light Source Laboratory, using a white beam for excitation and a Si(Li) detector for X-ray detection. In several samples, P, K, Ca, Ti, Fe, Sr, Ba and Pb were quantified. The K/Ca, K/P and Pb/Ca ratios were found to decrease towards the bark.

  11. Monitoring of the environmental pollution by trace element analysis in tree-rings using synchrotron radiation total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Sirito de Vives, Ana Elisa; Moreira, Silvana; Brienza, Sandra Maria Boscolo; Silva Medeiros, Jean Gabriel; Tomazello Filho, Mario Tomazello; Araujo Domingues Zucchi, Orgheda Luiza; Nascimento Filho, Virgilio Franco do

    2006-01-01

    This paper aims to study the environmental pollution in the tree development, in order to evaluate its use as bioindicator in urban and country sides. The sample collection was carried out in Piracicaba city, Sao Paulo State, which presents high level of environmental contamination in water, soil and air, due to industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. The species Caesalpinia peltophoroides ('Sibipiruna') was selected because it is widely used in urban forestation. Synchrotron Radiation Total Reflection X-ray Fluorescence technique (SR-TXRF) was employed to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was performed in the Brazilian Synchrotron Light Source Laboratory, using a white beam for excitation and a Si(Li) detector for X-ray detection. In several samples, P, K, Ca, Ti, Fe, Sr, Ba and Pb were quantified. The K/Ca, K/P and Pb/Ca ratios were found to decrease towards the bark

  12. Monitoring environmental pollution of trace elements in tree-rings by synchrotron radiation total reflection X-ray fluorescence analysis (SR-TXRF)

    Energy Technology Data Exchange (ETDEWEB)

    Moreira, Silvana [Universidade Estadual de Campinas, SP (Brazil). Faculdade de Engenharia Civil, Arquitetura e Urbanismo]. E-mail: Silvana@fec.unicamp.br; Vives, Ana Elisa S. de [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil). Faculdade de Engenharia, Arquitetura e Urbanismo]. E-mail: aesvives@unimep.br; Brienza, Sandra Maria B. [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil) Faculdade de Ciencias Matematicas, da Natureza e de Tecnologia da Informacao]. E-mail: sbrienza@unimep.br; Medeiros, Jean Gabriel S.; Tomazello Filho, Mario [Sao Paulo Univ., Piracicaba, SP (Brazil). Escola Superior de Agricultura Luiz de Queiroz]. E-mail: jeangm@esalq.usp.br; mtomazel@esalq.usp.br; Zucchi, Orgheda L.A.D. [Sao Paulo Univ., Ribeirao Preto, SP (Brazil). Faculdade de Ciencias Farmaceuticas]. E-mail: olzucchi@fcfrp.usp.br; Nascimento Filho, Virgilio F. [Centro de Energia Nuclear na Agricultura (CENA), Piracicaba, SP (Brazil). Lab. de Instrumentacao Nuclear]. E-mail: virgilio@cena.usp.br

    2005-07-01

    This paper aims to study the environmental pollution in the tree development, as a manner to evaluate its use as bioindicator in urban and country sides. The sample collecting was carry out in Piracicaba city, Sao Paulo State, that presents high level of environmental contamination of the water, soil and air, due industrial activities, vehicles combustion, sugar-cane leaves burning in the harvesting, etc. It was selected the Caesalpinia peltophoroides ('Sibipiruna') specie because its very used in urban arborization. It was employed the analytical technique named total reflection X-ray fluorescence (TXRF) to identify and quantify the elements and metals of nutritional and toxicological importance in the wood samples. The analysis was done in the Brazilian Synchrotron Light Laboratory, using a white beam for excitation and a Si(Li) detector for characteristic X-ray detection. It was quantified the P, K, Ca, Ti, Fe, Sr, Ba e Pb elements. (author)

  13. X-ray fluorescence imaging with polycapillary X-ray optics

    International Nuclear Information System (INIS)

    Yonehara, Tasuku; Yamaguchi, Makoto; Tsuji, Kouichi

    2010-01-01

    X-ray fluorescence spectrometry imaging is a powerful tool to provide information about the chemical composition and elemental distribution of a specimen. X-ray fluorescence spectrometry images were conventionally obtained by using a μ-X-ray fluorescence spectrometry spectrometer, which requires scanning a sample. Faster X-ray fluorescence spectrometry imaging would be achieved by eliminating the process of sample scanning. Thus, we developed an X-ray fluorescence spectrometry imaging instrument without sample scanning by using polycapillary X-ray optics, which had energy filter characteristics caused by the energy dependence of the total reflection phenomenon. In the present paper, we show that two independent straight polycapillary X-ray optics could be used as an energy filter of X-rays for X-ray fluorescence. Only low energy X-rays were detected when the angle between the two optical axes was increased slightly. Energy-selective X-ray fluorescence spectrometry images with projection mode were taken by using an X-ray CCD camera equipped with two polycapillary optics. It was shown that Fe Kα (6.40 keV) and Cu Kα (8.04 keV) could be discriminated for Fe and Cu foils.

  14. Synchrotron radiation total reflection x-ray fluorescence analysis; of polymer coated silicon wafers

    International Nuclear Information System (INIS)

    Brehm, L.; Kregsamer, P.; Pianetta, P.

    2000-01-01

    It is well known that total reflection x-ray fluorescence (TXRF) provides an efficient method for analyzing trace metal contamination on silicon wafer surfaces. New polymeric materials used as interlayer dielectrics in microprocessors are applied to the surface of silicon wafers by a spin-coating process. Analysis of these polymer coated wafers present a new challenge for TXRF analysis. Polymer solutions are typically analyzed for bulk metal contamination prior to application on the wafer using inductively coupled plasma mass spectrometry (ICP-MS). Questions have arisen about how to relate results of surface contamination analysis (TXRF) of a polymer coated wafer to bulk trace analysis (ICP-MS) of the polymer solutions. Experiments were done to explore this issue using synchrotron radiation (SR) TXRF. Polymer solutions were spiked with several different concentrations of metals. These solutions were applied to silicon wafers using the normal spin-coating process. The polymer coated wafers were then measured using the SR-TXRF instrument set-up at the Stanford Synchrotron Radiation Laboratory (SSRL). Several methods of quantitation were evaluated. The best results were obtained by developing calibration curves (intensity versus ppb) using the spiked polymer coated wafers as standards. Conversion of SR-TXRF surface analysis results (atoms/cm 2 ) to a volume related concentration was also investigated. (author)

  15. Sample preparation for total reflection X-ray fluorescence analysis using resist pattern technique

    Science.gov (United States)

    Tsuji, K.; Yomogita, N.; Konyuba, Y.

    2018-06-01

    A circular resist pattern layer with a diameter of 9 mm was prepared on a glass substrate (26 mm × 76 mm; 1.5 mm thick) for total reflection X-ray fluorescence (TXRF) analysis. The parallel cross pattern was designed with a wall thickness of 10 μm, an interval of 20 μm, and a height of 1.4 or 0.8 μm. This additional resist layer did not significantly increase background intensity on the XRF peaks in TXRF spectra. Dotted residue was obtained from a standard solution (10 μL) containing Ti, Cr, Ni, Pb, and Ga, each at a final concentration of 10 ppm, on a normal glass substrate with a silicone coating layer. The height of the residue was more than 100 μm, where self-absorption in the large residue affected TXRF quantification (intensity relative standard deviation (RSD): 12-20%). In contrast, from a droplet composed of a small volume of solution dropped and cast on the resist pattern structure, the obtained residue was not completely film but a film-like residue with a thickness less than 1 μm, where self-absorption was not a serious problem. In the end, this sample preparation was demonstrated to improve TXRF quantification (intensity RSD: 2-4%).

  16. Azimuthal and polar angle dependence of L X-ray differential cross-sections of Yb at 59.54 keV photon energy

    Energy Technology Data Exchange (ETDEWEB)

    Akkuş, T.; Şahin, Y.; Yılmaz, D., E-mail: ddemir@atauni.edu.tr

    2016-01-01

    Highlights: • The azimuthal and polar angle dependence of L X-ray for Yb is investigated. • The azimuthal angle dependence of Ll and Lα X-rays are observed. • The azimuthal anisotropy of Lβ and Lγ X-rays are not observed. • The polar anisotropy of Ll and Lα X-rays are observed. • The polar anisotropy of Lβ and Lγ X-rays are not observed. - Abstract: The azimuthal and polar angle dependence of L X-ray was investigated in the same experimental setup to remove the existing ambiguity about alignments measurements. We measured Ll, Lα, Lβ and Lγ X-ray differential cross sections of Yb for several different azimuthal angles (30°, 20°, 10°, 0°, −10° and −20°) and polar angles (90°, 100°, 110°, 120°, 130° and 140°) at 59.54 keV photon energy by using a Si(Li) detector. The azimuthal angle dependence of Ll and Lα X-rays were observed. The azimuthal anisotropy of Lβ and Lγ X-rays were not observed. On the other hand, differential cross-sections for Lβ and Lγ X-rays were found independent on the polar angle within experimental error, those for Ll and Lα X-rays depended on the polar angles. Azimuthal and polar angles dependence of L X-ray differential cross-sections contrast with the other experimental and theoretical results, which report evidence of the isotropic emission of Ll and Lα X-rays following photoionization.

  17. Polarization of X-ray lines emitted from plasma-focus discharges; Problems of interpretation

    International Nuclear Information System (INIS)

    Jakubowski, L.

    2002-01-01

    In high current pulse discharges of the Plasma Focus (PF) type, inside the collapsing pinch column, there are formed local micro-regions of high-density and high-temperature plasma, so-called hot spots. Individual hot spots are separated in space and time. Each hot spot is characterized by its specific electron concentration and temperature, as well as by the emission of X-ray lines with different polarization. When numerous hot spots are produced it is impossible to determine local plasma parameters and to interpret the polarization effects. To eliminate this problem this study was devoted to the realization of PF-type discharges with single hot spot only. It has been achieved by a choice of the electrode configuration, which facilitated the formation of a single hot spot emitting intense X-ray lines. At the chosen experimental conditions it was possible to determine local plasma parameters and to demonstrate evident differences in the polarization of the observed X-ray lines. (author)

  18. X-ray polarization studies of plasma focus experiments with a single hot spots

    International Nuclear Information System (INIS)

    Jakubowski, L.; Sadowski, M.J.; Baronova, E.O.

    2004-01-01

    In high current pulse discharges of the plasma focus (PF) type, inside the collapsing pinch column, there are formed local micro-regions of high-density and high-temperature plasma, so-called hot spots. Individual hot spots are separated in space and time. Each hot spot is characterized by its specific electron concentration and temperature, as well as by the emission of x-ray lines with different polarization. When numerous hot spots are produced it is impossible to determine local plasma parameters and to interpret the polarization effects. To eliminate this problem this study was devoted to the realization of PF-type discharges with single hot spot only. It has been achieved by a choice of the electrode configuration, which facilitated the formation of a single hot spot emitting intense x-ray lines. At the chosen experimental conditions it was possible to determine local plasma parameters and to demonstrate evident differences in the polarization of the observed x-ray lines. (author)

  19. Polarization of x-ray lines emitted from plasma-focus discharges; Problems of interpretation

    International Nuclear Information System (INIS)

    Jakubowski, L.; Sadowski, M.J.; Baronova, E.O.

    2003-01-01

    In high current pulse discharges of the Plasma Focus (PF) type, inside the collapsing pinch column, there are formed local micro-regions of high-density and high-temperature plasma, so-called hot spots. Individual hot spots are separated in space and time. Each hot spot is characterized by its specific electron concentration and temperature, as well as by the emission of X-ray lines with different polarization. When numerous hot spots are produced it is impossible to determine local plasma parameters and to interpretate the polarization effects. To eliminate this problem this study was devoted to the realization of PF-type discharges with single hot spot only. It has been achieved by a choice of the electrode configuration, which facilitated the formation of a single hot spot emitting intense X-ray lines. At the chosen experimental conditions it was possible to determine local plasma parameters and to demonstrate evident differences in the polarization of the observed X-ray lines. (author)

  20. SENSITIVITY OF STACKED IMAGING DETECTORS TO HARD X-RAY POLARIZATION

    Energy Technology Data Exchange (ETDEWEB)

    Muleri, Fabio; Campana, Riccardo, E-mail: fabio.muleri@iaps.inaf.it [INAF-IAPS, Via del Fosso del Cavaliere 100, I-00133 Roma (Italy)

    2012-06-01

    The development of multi-layer optics which allow to focus photons up to 100 keV and more promises an enormous jump in sensitivity in the hard X-ray energy band. This technology is already planned to be exploited by future missions dedicated to spectroscopy and imaging at energies >10 keV, e.g., Astro-H and NuSTAR. Nevertheless, our understanding of the hard X-ray sky would greatly benefit from carrying out contemporaneous polarimetric measurements, because the study of hard spectral tails and of polarized emission are often two complementary diagnostics of the same non-thermal and acceleration processes. At energies above a few tens of keV, the preferred technique to detect polarization involves the determination of photon directions after a Compton scattering. Many authors have asserted that stacked detectors with imaging capabilities can be exploited for this purpose. If it is possible to discriminate those events which initially interact in the first detector by Compton scattering and are subsequently absorbed by the second layer, then the direction of scattering is singled out from the hit pixels in the two detectors. In this paper, we give the first detailed discussion of the sensitivity of such a generic design to the X-ray polarization. The efficiency and the modulation factor are calculated analytically from the geometry of the instruments and then compared with the performance as derived by means of Geant4 Monte Carlo simulations.

  1. Polarized wiggler for NSLS x-ray ring design considerations

    International Nuclear Information System (INIS)

    Friedman, A.; Krinsky, S.; Blum, E.

    1992-03-01

    We examine the properties of an elliptically polarized wiggler that will generate circularly polarized photons with energy spectrum of 3--12 KeV. The vertical wiggler magnetic field is produced by permanent magnets while the horizontal wiggler field is generated by electric coils capable of AC excitation. The radiation parameters of the wiggler are presented, including photon flux, circular and linear polarization and spectrum. These parameters are compared to the synchrotron radiation from a bending magnet. Numerical values are calculated for radiation from the wiggler and bending magnet for the NSLS X-ray ring parameters. A conceptual design for such a wiggler is discussed and several different alternatives are analyzed. We consider AC excitation of the wiggler to produce the time modulation of the elliptic polarization, and also to produce time modulated linearly polarized radiation

  2. On the X-ray reflectivity by poly allyl diglycol carbonate (PADC)

    International Nuclear Information System (INIS)

    Ghazaly, M. El

    2011-01-01

    X-ray reflectivity via the poly allyl diglycol carbonate (CR-39 polymer sheet) was investigated. X-ray reflectivity was measured for a pristine and a chemically etched CR-39 detector in 6.25N NaOH at (70 ± 0.5) .deg. C for different durations. Far from the spectral peak, the reflectivity of the CR-39 polymer sheet has a wide peak at 2θ = 20.1 .deg. , and its intensity is decreased by increasing the etching time. Moreover, the integrated counts under the peaks, C(t e ), vary linearly as a function of the etching time t e . Data are fitted using a linear function C(t e ) = A+Bt e , with fitting parameters A = (3271 ± 170) and B = (- 960 ± 84). The reflectivity deterioration is attributed to the increase of CR-39 surface's roughness due to the chemical etching. The rocking curves of X-ray reflectivity were measured for a pristine and an etched CR-39 polymer sheet. Specular reflections are observed, as well as Yoneda wings, which broaden and move away from the specular reflections due to the increase in the CR-39 surface's roughness.

  3. Rotation of X-ray polarization in the glitches of a silicon crystal monochromator

    Energy Technology Data Exchange (ETDEWEB)

    Sutter, John P.; Boada, Roberto; Bowron, Daniel T.; Stepanov, Sergey A.; Díaz-Moreno, Sofía

    2016-07-06

    EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the `glitches' produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specific crystal orientations. If incorrectly compensated, they degrade the spectroscopic data. Normalization of the fluorescence signal by the incident flux alone is sometimes insufficient to compensate for the glitches. Measurements performed at the state-of-the-art wiggler beamline I20-scanning at Diamond Light Source have shown that the glitches alter the spatial distribution of the sample's quasi-elastic X-ray scattering. Because glitches result from additional Bragg reflections, multiple-beam dynamical diffraction theory is necessary to understand their effects. Here, the glitches of the Si(111) four-bounce monochromator of I20-scanning just above the Ni Kedge are associated with their Bragg reflections. A fitting procedure that treats coherent and Compton scattering is developed and applied to a sample of an extremely dilute (100 micromolal) aqueous solution of Ni(NO3)2. The depolarization of the wiggler X-ray beam out of the electron orbit is modeled. The fits achieve good agreement with the sample's quasi-elastic scattering with just a few parameters. The X-ray polarization is rotated up to ±4.3° within the glitches, as predicted by dynamical diffraction. These results will help users normalize EXAFS data at glitches.

  4. Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

    International Nuclear Information System (INIS)

    Singh, Surendra; Basu, Saibal

    2016-01-01

    X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

  5. Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

    Science.gov (United States)

    Singh, Surendra; Basu, Saibal

    2016-05-01

    X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

  6. Simultaneous parameter optimization of x-ray and neutron reflectivity data using genetic algorithms

    Energy Technology Data Exchange (ETDEWEB)

    Singh, Surendra, E-mail: surendra@barc.gov.in; Basu, Saibal [Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai 400085 India (India)

    2016-05-23

    X-ray and neutron reflectivity are two non destructive techniques which provide a wealth of information on thickness, structure and interracial properties in nanometer length scale. Combination of X-ray and neutron reflectivity is well suited for obtaining physical parameters of nanostructured thin films and superlattices. Neutrons provide a different contrast between the elements than X-rays and are also sensitive to the magnetization depth profile in thin films and superlattices. The real space information is extracted by fitting a model for the structure of the thin film sample in reflectometry experiments. We have applied a Genetic Algorithms technique to extract depth dependent structure and magnetic in thin film and multilayer systems by simultaneously fitting X-ray and neutron reflectivity data.

  7. Development of a New X-Ray Polarization Detection Device

    Science.gov (United States)

    Thompson, Jahreem R.; Hill, Joanne E.; Jahoda, Keith; Black, Kevin; Querrard, Rodney

    2018-01-01

    The aim of this research is to confirm the functionality of a Gas Electron Multiplier made of stainless steel in a detection medium of carbon dioxide and nitromethane through a series of X-ray tests in a vacuum chamber. Utilizing the photoelectric effect with carbon dioxide and nitromethane, we can confirm polarization of X-rays emitted from the most extreme astronomical conditions. We chose to use CO2 because we can confirm that it works well with the stainless-steel detector based on previous tests and nitromethane because we suspect that the ionization electrons created by the photoelectron during the photoelectric effect will experience less diffusion if they are bonded to a large molecule such as nitromethane as they diffuse towards the drift plate. The development of these new X-ray polarimeters will help to further the study of gravitational fields near black holes, their effects on matter they encounter, and the magnetic fields of neutron stars.

  8. Imaging Local Polarization in Ferroelectric Thin Films by Coherent X-Ray Bragg Projection Ptychography

    Science.gov (United States)

    Hruszkewycz, S. O.; Highland, M. J.; Holt, M. V.; Kim, Dongjin; Folkman, C. M.; Thompson, Carol; Tripathi, A.; Stephenson, G. B.; Hong, Seungbum; Fuoss, P. H.

    2013-04-01

    We used x-ray Bragg projection ptychography (BPP) to map spatial variations of ferroelectric polarization in thin film PbTiO3, which exhibited a striped nanoscale domain pattern on a high-miscut (001) SrTiO3 substrate. By converting the reconstructed BPP phase image to picometer-scale ionic displacements in the polar unit cell, a quantitative polarization map was made that was consistent with other characterization. The spatial resolution of 5.7 nm demonstrated here establishes BPP as an important tool for nanoscale ferroelectric domain imaging, especially in complex environments accessible with hard x rays.

  9. Reflectivity and diffraction of X rays applied to organic thin films

    International Nuclear Information System (INIS)

    Rieutord, Francois

    1987-01-01

    This research thesis reports the study of organic thin films by using X-ray-based technologies, and more particularly X-ray reflectivity. After some recalls on X ray diffraction, and on the fabrication of Langmuir-Blodgett films, the author shows how, by combining three X-ray-based techniques, it is possible to study a volume structure of a thin film. He describes the technique of measurement by X- ray reflexivity, its experimental implementation, and methods for result interpretation. In the next part, the author reports the study of peculiar interference effects which are noticed in reflexivity on Langmuir-Blodgett films, and then describes the nature of these films by correlating results of X ray reflexivity with direct observations performed by electronic microscopy on replica [fr

  10. Next Generation X-ray Polarimeter

    Science.gov (United States)

    Hill-Kittle, Joe

    The emission regions of many types of X-ray sources are small and cannot be spatially resolved without interferometry techniques that haven't yet been developed. In order to understand the emission mechanisms and emission geometry, alternate measurement techniques are required. Most microphysical processes that affect X-rays, including scattering and magnetic emission processes are imprinted as polarization signatures. X-ray polarization also reveals exotic physical processes occurring in regions of very strong gravitational and magnetic fields. Observations of X-ray polarization will provide a measurement of the geometrical distribution of gas and magnetic fields without foreground depolarization that affects longer wavelengths (e.g. Faraday rotation in the radio). Emission from accretion disks has an inclination-dependent polarization. The polarization signature is modified by extreme gravitational forces, which bend light, essentially changing the contribution of each part of the disk to the integrated total intensity seen by distant observers. Because gravity has the largest effect on the innermost parts of the disk (which are the hottest, and thus contributes to more high energy photons), the energy dependent polarization is diagnostic of disk inclination, black hole mass and spin. Increasing the sensitive energy band will make these measurements possible. X-ray polarimetry will also enable the study of the origin of cosmic rays in the universe, the nature of black holes, the role of black holes in the evolution of galaxies, and the interaction of matter with the highest physically possible magnetic fields. These objectives address NASA's strategic interest in the origin, structure, and evolution of the universe. We propose a two-year effort to develop the Next Generation X-ray Polarimeter (NGXP) that will have more than ten times the sensitivity of the current state of the art. NGXP will make possible game changing measurements of classes of astrophysical

  11. Modelling of a total reflection X-ray fluorescence (TXRF) system ...

    African Journals Online (AJOL)

    The simulation of the different stages involved in x-ray fluorescence emissions was carried out by writing a suite of computer programs using FORTRAN programming language. These computer simulated XRF stages were then integrated together to generate a general robust model which was run with the digital visual ...

  12. Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

    Energy Technology Data Exchange (ETDEWEB)

    Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

    2014-09-01

    The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

  13. Multielemental analysis in cigarettes using total reflection X-ray fluorescence with synchrotron radiation

    International Nuclear Information System (INIS)

    Barbosa, R.F.; Anjos, M.J. dos; Jesus, E.F.O. de; Lopes, R.T.; Moreira, S.

    2008-01-01

    Full text: It is well known that trace elements have important ejects in the life processes. Some of these elements are toxic for the human even at a very low level of intake. It is known that tobacco plant easily absorbs the heavy metals from the soil, especially Cd and Ni, accumulating them in its leaves. Part of these metals are transferred from tobacco to human body where they will be accumulated and damage some organs, mainly kidneys and liver. In this way, cigarettes are responsible for the death of millions of people in the world, about one death every eight seconds. The aim of this work was to determine the elemental concentrations of ten different elements in tobacco of Brazilian cigarettes used Total Reflection X-Ray Fluorescence with Synchrotron Radiation method. The fluorescence measurements were carried out at Brazilian Synchrotron Light Laboratory, Campinas - Sao Paulo. A qualitative analysis of spectral peaks showed that the samples contained potassium, calcium, titanium, chromium, manganese, iron, copper, rubidium and strontium. Among these elements, calcium, potassium and iron presented the highest concentrations. There was a wide range in the elemental concentrations in the tobacco, due various factors, such as agricultural practices, soil characteristics, climatic conditions and plant varieties. Our results are in good concern with the results reported by the scientific literature

  14. Quantitative determination on heavy metals in different stages of wine production by Total Reflection X-ray Fluorescence and Energy Dispersive X-ray Fluorescence: Comparison on two vineyards

    Energy Technology Data Exchange (ETDEWEB)

    Pessanha, Sofia [Centro Fisica Atomica, Departamento de Fisica, Faculdade de Ciencias, Universidade de Lisboa, Av. Prof. Gama Pinto, 2, 1649-003 Lisboa (Portugal); Carvalho, Maria Luisa, E-mail: luisa@cii.fc.ul.p [Centro Fisica Atomica, Departamento de Fisica, Faculdade de Ciencias, Universidade de Lisboa, Av. Prof. Gama Pinto, 2, 1649-003 Lisboa (Portugal); Becker, Maria; Bohlen, Alex von [Institute for analytical Sciences, Bunsen-Kirchhoff-Str. 11, 44139 Dortmund (Germany)

    2010-06-15

    The purpose of this study is to determine the elemental content, namely heavy metals, of samples of vine-leaves, grapes must and wine. In order to assess the influence of the vineyard age on the elemental content throughout the several stages of wine production, elemental determinations of trace elements were made on products obtained from two vineyards aged 6 and 14 years from Douro region. The elemental content of vine-leaves and grapes was determined by Energy Dispersive X-Ray Fluorescence (EDXRF), while analysis of the must and wine was performed by Total Reflection X-ray Fluorescence (TXRF). Almost all elements present in wine and must samples did not exceed the recommended values found in literature for wine. Bromine was present in the 6 years old wine in a concentration 1 order of magnitude greater than what is usually detected. The Cu content in vine-leaves from the older vineyard was found to be extremely high probably due to excessive use of Cu-based fungicides to control vine downy mildew. Higher Cu content was also detected in grapes although not so pronounced. Concerning the wine a slightly higher level was detected on the older vineyard, even so not exceeding the recommended value.

  15. Quantitative determination on heavy metals in different stages of wine production by Total Reflection X-ray Fluorescence and Energy Dispersive X-ray Fluorescence: Comparison on two vineyards

    International Nuclear Information System (INIS)

    Pessanha, Sofia; Carvalho, Maria Luisa; Becker, Maria; Bohlen, Alex von

    2010-01-01

    The purpose of this study is to determine the elemental content, namely heavy metals, of samples of vine-leaves, grapes must and wine. In order to assess the influence of the vineyard age on the elemental content throughout the several stages of wine production, elemental determinations of trace elements were made on products obtained from two vineyards aged 6 and 14 years from Douro region. The elemental content of vine-leaves and grapes was determined by Energy Dispersive X-Ray Fluorescence (EDXRF), while analysis of the must and wine was performed by Total Reflection X-ray Fluorescence (TXRF). Almost all elements present in wine and must samples did not exceed the recommended values found in literature for wine. Bromine was present in the 6 years old wine in a concentration 1 order of magnitude greater than what is usually detected. The Cu content in vine-leaves from the older vineyard was found to be extremely high probably due to excessive use of Cu-based fungicides to control vine downy mildew. Higher Cu content was also detected in grapes although not so pronounced. Concerning the wine a slightly higher level was detected on the older vineyard, even so not exceeding the recommended value.

  16. POLAR on board of the Tiangong 2 Chinese space station: measuring the polarization of hard X-rays photons, in particular the polarization of prompt photons from gamma ray bursts.

    Science.gov (United States)

    Produit, Nicolas

    2012-07-01

    POLAR is an homogeneous wide field Compton polarimeter using plastic scintillators and multichannel photomultipliers. The goal of this polarimeter is to measure with controlled systematics the polarization of hard X-ray emitted by unpredictable transient sources The instrument energy range sensitivity is optimized for the detection of the prompt emission of Gamma-Ray Bursts (GRB). Monte-Carlo studies and calibration data collected in polarized photon beams predict that POLAR will be able to measure the polarization degree of 10 GRB per year with a combined systematics and statistical accuracy of better then 10%. POLAR will be mounted outside of the Tiangong 2 Chinese space station that will be launched in space in 2014.

  17. Instrumentations in x-ray plasma polarization spectroscopy. Crystal spectrometer, polarimeter and detectors for astronomical observations

    Energy Technology Data Exchange (ETDEWEB)

    Baronova, Elena O.; Stepanenko, Mikhail M. [RRC Kurchatov Institute, Nuclear Fusion Institute, Moscow (Russian Federation); Jakubowski, Lech [Soltan Institute for Nuclear Studies, Swierk-Otwock (Poland); Tsunemi, Hiroshi [Osaka Univ., Graduate School of Science, Osaka (Japan)

    2002-08-01

    This report discusses the various problems which are encountered when a crystal spectrometer is used for the purpose of observing polarized x-ray lines. A polarimeter is proposed based on the novel idea of using two series of equivalent atomic planes in a single crystal. The present status of the astronomical x-ray detection techniques are described with emphasis on two dimensional detectors which are polarization sensitive. (author)

  18. Self-consistent approach to x-ray reflection from rough surfaces

    International Nuclear Information System (INIS)

    Feranchuk, I. D.; Feranchuk, S. I.; Ulyanenkov, A. P.

    2007-01-01

    A self-consistent analytical approach for specular x-ray reflection from interfaces with transition layers [I. D. Feranchuk et al., Phys. Rev. B 67, 235417 (2003)] based on the distorted-wave Born approximation (DWBA) is used for the description of coherent and incoherent x-ray scattering from rough surfaces and interfaces. This approach takes into account the transformation of the modeling transition layer profile at the interface, which is caused by roughness correlations. The reflection coefficients for each DWBA order are directly calculated without phenomenological assumptions on their exponential decay at large scattering angles. Various regions of scattering angles are discussed, which show qualitatively different dependence of the reflection coefficient on the scattering angle. The experimental data are analyzed using the method developed

  19. High Reflectance Nanoscale V/Sc Multilayer for Soft X-ray Water Window Region.

    Science.gov (United States)

    Huang, Qiushi; Yi, Qiang; Cao, Zhaodong; Qi, Runze; Loch, Rolf A; Jonnard, Philippe; Wu, Meiyi; Giglia, Angelo; Li, Wenbin; Louis, Eric; Bijkerk, Fred; Zhang, Zhong; Wang, Zhanshan

    2017-10-10

    V/Sc multilayer is experimentally demonstrated for the first time as a high reflectance mirror for the soft X-ray water window region. It primarily works at above the Sc-L edge (λ = 3.11 nm) under near normal incidence while a second peak appears at above the V-L edge (λ = 2.42 nm) under grazing incidence. The V/Sc multilayer fabricated with a d-spacing of 1.59 nm and 30 bilayers has a smaller interface width (σ = 0.27 and 0.32 nm) than the conventional used Cr/Sc (σ = 0.28 and 0.47 nm). For V/Sc multilayer with 30 bilayers, the introduction of B 4 C barrier layers has little improvement on the interface structure. As the number of bilayers increasing to 400, the growth morphology and microstructure of the V/Sc layers evolves with slightly increased crystallization. Nevertheless, the surface roughness remains to be 0.25 nm. A maximum soft X-ray reflectance of 18.4% is measured at λ = 3.129 nm at 9° off-normal incidence using the 400-bilayers V/Sc multilayer. According to the fitted model, an s-polarization reflectance of 5.2% can also be expected at λ = 2.425 nm under 40° incidence. Based on the promising experimental results, further improvement of the reflectance can be achieved by using a more stable deposition system, exploring different interface engineering methods and so on.

  20. Polarization study of non-resonant X-ray magnetic scattering from spin-density-wave modulation in chromium

    International Nuclear Information System (INIS)

    Ohsumi, Hiroyuki; Takata, Masaki

    2007-01-01

    We present a polarization study of non-resonant X-ray magnetic scattering in pure chromium. Satellite reflections are observed at +/-Q and +/-2Q, where Q is the modulation wave vector of an itinerant spin-density-wave. The first and second harmonics are confirmed to have magnetic and charge origin, respectively, by means of polarimetry without using an analyzer crystal. This alternative technique eliminates intolerable intensity loss at an analyzer by utilizing the sample crystal also as an analyzer crystal

  1. Ultra-short-period W/B4C multilayers for x-ray optics-microstructure limits on reflectivity

    Energy Technology Data Exchange (ETDEWEB)

    Walton, Christopher Charles [Univ. of California, Berkeley, CA (United States). Dept. of Materials Science and Mineral Engineering

    1997-12-01

    Multilayer thin films are used as Bragg reflectors for soft x-rays in the energy range 50eV < E < 1000eV in many x-ray optics applications such as x-ray microscopes and telescopes, reducing optics for extreme ultraviolet (EUV) lithography, and x-ray polarizers and phase retarders. Applications often depend critically on reflectivity, which has not been systematically characterized for multilayer periods below 20Å. For this study, W/B4C multilayers were fabricated by magnetron sputtering on Si(111), with periods from 48Å to as little as 4.7Å. The x-ray reflectivity measured at λ = 1.54Å and at 45° incidence (289 eV < E < 860 eV) was found to decrease sharply for multilayer periods less than 15-20Å. Examination by high-resolution transmission electron microscopy (HRTEM) showed an expansion of the thickness of the W-rich layers of 30-40% from the nominal values, consistent with intermixture of the two materials during sputter growth, and discontinuous W-rich layers for multilayer periods below about 15Å. The experimental data for the specular reflectivity in the hard and soft x-ray regimes and the diffuse scattering fit well to a model of multilayer roughness. The model is expressed as a power-law dependence of roughness on spatial frequency. Analysis of small-angle scattering in transmission from multilayers grown on freestanding Si3N4 membranes confirms the onset of discontinuity at periods between 14Å and 22Å. Spectroscopy studies by x-ray absorption (NEXAFS) and electron energy loss (EELS) at the boron K-edge (188eV) are consistent with changes in the average boron bonding environment, as the multilayer period decreases and the W-rich layers are increasingly thin and dispersed. A discrete W-rich phase is present for periods at least as small as 6.3Å.

  2. Room temperature trapping of stibine and bismuthine onto quartz substrates coated with nanostructured palladium for total reflection X-ray fluorescence analysis

    Energy Technology Data Exchange (ETDEWEB)

    Romero, Vanesa; Costas-Mora, Isabel; Lavilla, Isela; Bendicho, Carlos, E-mail: bendicho@uvigo.es

    2015-05-01

    In this work, a novel method for determining Sb and Bi based on the trapping of their covalent hydrides onto quartz reflectors coated with immobilized palladium nanoparticles (Pd NPs) followed by total reflection X-ray fluorescence (TXRF) analysis is proposed. Pd NPs were synthesized by chemical reduction of the metal precursor using a mixture of water:ethanol as mild reducing agent. Silanization using 3-mercaptopropyltrimethoxysilane (MPTMS) was performed for the immobilization of Pd NPs onto the quartz substrates. Volatile hydrides (stibine and bismuthine) generated by means of a continuous flow system were flushed onto the immobilized Pd NPs and retained by catalytic decomposition. As a result of the high catalytic activity of the nanostructured film, trapping can be performed at ambient temperature with good efficiency. Limits of detection (LODs) were 2.3 and 0.70 μg L{sup −1} for Sb and Bi, respectively. Enrichment factors of 534 and 192 were obtained for Sb and Bi, respectively. The new method was applied for the analysis of several matrices (milk, soil, sediment, cutaneous powder). Recoveries were in the range of 98.4–101% for both elements with a relative standard deviation of 2.5% (N = 5). - Highlights: • A novel method for trapping covalent hydrides of antimony and bismuth is proposed. • Emphasis is placed on the application of Pd nanoparticles as trapping surface. • The nanostructured surface provides high catalytic activity at ambient temperature. • Analysis by total reflection X-ray fluorescence is performed. • Determination of Bi and Sb in different matrices is carried out.

  3. Collection of airborne particulate matter for a subsequent analysis by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Klockenkaemper, R.; Bayer, H.; Bohlen, A. von; Schmeling, M.; Klockow, D.

    1995-01-01

    The collection of airborne particulate matter by filtration and impaction was adapted to total reflection X-ray fluorescence analysis (TXRF). Cellulose nitrate filters were used for collecting in a Berner impactor. Single filter spots were punched out, placed on quartz-glass carriers, dissolved by tetrahydrofuran and re-precipitated prior to element determinations by TXRF. In a Battelle-type impactor, airborne dust was collected on Plexiglass carriers coated with medical Vaseline. The loaded carriers were directly analyzed by TXRF. In both cases, quantification was simply performed by the addition of an internal standard after sampling. Impactors were made of a suitable material in order to investigate high blank values, collection losses and memory effects. It could be shown that stainless steel, even coated with TiN, is less suitable and should be avoided as an impactor material. Although aluminum is partly recommendable, titanium and the polymer Makrolon are quite appropriate. By using an impactor made of these materials, a reliable multielement determination in airborne dust is made possible with low detection limits as low as 1 ng/m 3 and a satisfactory repeatability of a few %. Short sampling times of only 1 h or less can be realized. The total procedure is simple and time-saving, and can be recommended for routine investigations of airborne particulate matter. (author)

  4. Use of high-intensity sonication for pre-treatment of biological tissues prior to multielemental analysis by total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    De La Calle, Inmaculada; Costas, Marta; Cabaleiro, Noelia; Lavilla, Isela; Bendicho, Carlos

    2012-01-01

    In this work, two ultrasound-based procedures are developed for sample preparation prior to determination of P, K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, As, Se and Sr in biological tissues by total reflection X-ray fluorescence spectrometry. Ultrasound-assisted extraction by means of a cup-horn sonoreactor and ultrasonic-probe slurry sampling were compared with a well-established procedure such as magnetic agitation slurry sampling. For that purpose, seven certified reference materials and different real samples of animal tissue were used. Similar accuracy and precision is obtained with the three sample preparation approaches tried. Limits of detection were dependent on both the sample matrix and the sample pre-treatment used, best values being achieved with ultrasound-assisted extraction. Advantages of ultrasound-assisted extraction include reduced sample handling, decreased contamination risks (neither addition of surfactants nor use of foreign objects inside the extraction vial), simpler background (no solid particles onto the sample carrier) and improved recovery for some elements such as P. A mixture of 10% v/v HNO 3 + 20–40% v/v HCl was suitable for extraction from biological tissues. - Highlights: ► We implement high-intensity sonication for pre-treatment of biological tissues. ► Multielemental analysis is performed by total reflection X-ray spectrometry. ► Ultrasound-based procedures are developed and compared to conventional slurry preparation. ► Features such as background, recovery and sample handling are favored by using ultrasonic extraction.

  5. Compact X-ray sources: X-rays from self-reflection

    Science.gov (United States)

    Mangles, Stuart P. D.

    2012-05-01

    Laser-based particle acceleration offers a way to reduce the size of hard-X-ray sources. Scientists have now developed a simple scheme that produces a bright flash of hard X-rays by using a single laser pulse both to generate and to scatter an electron beam.

  6. Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

    Science.gov (United States)

    Bhattacharya, Debarati; Basu, Saibal; Singh, Surendra; Roy, Sumalay; Dev, Bhupendra Nath

    2012-12-01

    Interdiffusion occurring across the interfaces in a Si/Ni/Si layered system during deposition at room temperature was probed using x-ray reflectivity (XRR) and polarized neutron reflectivity (PNR). Exploiting the complementarity of these techniques, both structural and magnetic characterization with nanometer depth resolution could be achieved. Suitable model fitting of the reflectivity profiles identified the formation of Ni-Si mixed alloy layers at the Si/Ni and Ni/Si interfaces. The physical parameters of the layered structure, including quantitative assessment of the stoichiometry of interfacial alloys, were obtained from the analyses of XRR and PNR patterns. In addition, PNR provided magnetic moment density profile as a function of depth in the stratified medium.

  7. Multielement analysis of aerosol samples by X-ray fluorescence analysis with totally reflecting sample holders

    International Nuclear Information System (INIS)

    Ketelsen, P.; Knoechel, A.

    1984-01-01

    Aerosole samples on filter support were analyzed using the X-ray flourescence analytical method (Mo excitation) with totally reflecting sample carrier (TXFA). Wet decomposition of the sample material with HNO 3 in an enclosed system and subsequent sample preparation by evaporating an aliquot of the solution on the sample carrier yields detection limits up to 0.3 ng/cm 2 . The reproducibilities of the measurements of the elements K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, As, Se, Rb, Sr, Ba and Pb lie between 5 and 25%. Similar detection limits and reproducibilities are obtained, when low-temperature oxygen plasma is employed for the direct ashing of the homogenously covered filter on the sample carrier. For the systematic loss of elements both methods were investigated with radiotracers as well as with inactive techniques. A comparison of the results with those obtained by NAA, AAS and PIXE shows good agreement in most cases. For the bromine determination and the fast coverage of the main elements a possibility for measuring the filter membrane has been indicated, which neglects the ashing step. The corresponding detection limits are up to 3 ng/cm 2 . (orig.) [de

  8. A low cost multi-purpose experimental arrangement for variants in energy dispersive X-ray fluorescence analysis

    International Nuclear Information System (INIS)

    Nascimento Filho, V.F.; Silva, R.M.C.; Moraes, L.M.B.; Parreira, P.S.; Appoloni, R.C.; Silva, R.M.C.

    2005-01-01

    Based in an X-ray tower with four exits (two line and two point beams) experimental conditions were arranged to carry out variants in energy dispersive X-ray fluorescence analysis: (1) the conventional one (EDXRF), with excitation/detection of thin and thick samples, under vacuum and air atmosphere, (2) the X-ray energy dispersive micro- fluorescence analysis(μ-EDXRF), with 2D mapping, using a quartz capillar, (3) the total reflection X-ray fluorescence (TXRF), under He and air atmosphere, and (4) secondary target/polarized X-ray fluorescence (P-EDXRF). It was possible to use a Cu, Mo or W target on the X-ray tube, with or without filter (V, Fe, Ni and Zr), and Si(Li) or Si-PIN semicondutor detectors coupled to a multichannel analyzer. In addition, it was possible to use the point beam to carry out experiments on (5) X-ray radiography and (6) X-ray absorption, and the line beam on (7) X-ray diffractometry studies.

  9. Calibration of the Gamma-RAy Polarimeter Experiment (GRAPE) at a polarized hard X-ray beam

    International Nuclear Information System (INIS)

    Bloser, P.F.; Legere, J.S.; McConnell, M.L.; Macri, J.R.; Bancroft, C.M.; Connor, T.P.; Ryan, J.M.

    2009-01-01

    The Gamma-RAy Polarimeter Experiment (GRAPE) is a concept for an astronomical hard X-ray Compton polarimeter operating in the 50-500 keV energy band. The instrument has been optimized for wide-field polarization measurements of transient outbursts from energetic astrophysical objects such as gamma-ray bursts and solar flares. The GRAPE instrument is composed of identical modules, each of which consists of an array of scintillator elements read out by a multi-anode photomultiplier tube (MAPMT). Incident photons Compton scatter in plastic scintillator elements and are subsequently absorbed in inorganic scintillator elements; a net polarization signal is revealed by a characteristic asymmetry in the azimuthal scattering angles. We have constructed a prototype GRAPE module containing a single CsI(Na) calorimeter element, at the center of the MAPMT, surrounded by 60 plastic elements. The prototype has been combined with custom readout electronics and software to create a complete 'engineering model' of the GRAPE instrument. This engineering model has been calibrated using a nearly 100% polarized hard X-ray beam at the Advanced Photon Source at Argonne National Laboratory. We find modulation factors of 0.46±0.06 and 0.48±0.03 at 69.5 and 129.5 keV, respectively, in good agreement with Monte Carlo simulations. In this paper we present details of the beam test, data analysis, and simulations, and discuss the implications of our results for the further development of the GRAPE concept.

  10. Advanced analysis techniques for X-ray reflectivities. Theory and application

    Energy Technology Data Exchange (ETDEWEB)

    Zimmermann, Klaus Martin

    2005-07-01

    The first part of this thesis adresses the phase problem in X-ray reflectivity. The analytical properties of the reflection coefficient imply that the phase is completely determined by the Hilbert transform of the logarithm of the modulus and the zeros in the upper half complex plane (UHP). To account in addition for interfacial roughness, a new formula for the Hilbert-phase is derived.In the following, the conditions for which the reflection coefficient has zeros in the UHP is discussed and the existing sufficient condition is extended to rough multi-layer systems. Procedures for locating these zeros are developed. The second part of this thesis introduces a new iterative inversion method for X-ray reflectivity. It expands the profile in a set of eigenfunctions, which are discrete approximations of the eigenfunction of the classical reconstruction problem of a compact supported function from its partially known Fourier-transform. In this work, piecewise constant functions, polygons and second-order B-splines are used to expand the density profile. The eigenvalue problems for the calculation of the above mentioned approximations are stated and solved. The formalism for the calculation of the reflection coefficient for these profiles is developed in dynamical and single-scattering theory. In the experimental part of this work iterative inverse schemes are applied to the analysis of X-ray reflectivity. Different sample systems are investigated: For two titanium-carbon samples tiny details at the Ti/C interface such as the formation of a thin TiC layer can be observed.The density profiles obtained from the reflectivities taken from nickel-carbon samples show the formation of SiC inside the Si sub strate. Finally, the new inversion scheme is applied to a series of reflectivities from a 700 AaSiGe film on a substrate.

  11. Advanced analysis techniques for X-ray reflectivities. Theory and application

    International Nuclear Information System (INIS)

    Zimmermann, Klaus Martin

    2005-01-01

    The first part of this thesis adresses the phase problem in X-ray reflectivity. The analytical properties of the reflection coefficient imply that the phase is completely determined by the Hilbert transform of the logarithm of the modulus and the zeros in the upper half complex plane (UHP). To account in addition for interfacial roughness, a new formula for the Hilbert-phase is derived.In the following, the conditions for which the reflection coefficient has zeros in the UHP is discussed and the existing sufficient condition is extended to rough multi-layer systems. Procedures for locating these zeros are developed. The second part of this thesis introduces a new iterative inversion method for X-ray reflectivity. It expands the profile in a set of eigenfunctions, which are discrete approximations of the eigenfunction of the classical reconstruction problem of a compact supported function from its partially known Fourier-transform. In this work, piecewise constant functions, polygons and second-order B-splines are used to expand the density profile. The eigenvalue problems for the calculation of the above mentioned approximations are stated and solved. The formalism for the calculation of the reflection coefficient for these profiles is developed in dynamical and single-scattering theory. In the experimental part of this work iterative inverse schemes are applied to the analysis of X-ray reflectivity. Different sample systems are investigated: For two titanium-carbon samples tiny details at the Ti/C interface such as the formation of a thin TiC layer can be observed.The density profiles obtained from the reflectivities taken from nickel-carbon samples show the formation of SiC inside the Si sub strate. Finally, the new inversion scheme is applied to a series of reflectivities from a 700 AaSiGe film on a substrate.

  12. Element determination in natural biofilms of mine drainage water by total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Mages, Margarete; Tuempling, Wolf von Jr.; Veen, Andrea van der; Baborowski, Martina

    2006-01-01

    Human impacts like mining activities lead to higher element concentration in surface waters. For different pollution levels, the consequences for aquatic organisms are not yet investigated in detail. Therefore, the aim of this investigation is to determine the influence of mining affected surface waters on biofilms. Elements like heavy metals can be absorbed on cell walls and on polymeric substances or enter the cytoplasm of the cells. Thus, they are important for the optimization of industrial biotechnological processes and the environmental biotechnology. Beyond this, biofilms can also play an important role in wastewater treatment processes and serve as bioindicators in the aquatic environment. The presented total reflection X-ray fluorescence spectroscopic investigation was performed to compare the element accumulation behavior of biofilms grown on natural or on artificial materials of drainage water affected by former copper mining activities. A high salt and heavy metal pollution is characteristic for the drainage water. For an assessment of these results, samples from stream Schlenze upstream the confluence with the drainage water, a small tributary of the Saale River in central Germany, were analyzed, too

  13. Polarization phenomena in Al/p-CdTe/Pt X-ray detectors

    Energy Technology Data Exchange (ETDEWEB)

    Principato, F., E-mail: fabio.principato@unipa.it; Turturici, A.A.; Gallo, M.; Abbene, L.

    2013-12-01

    Over the last decades, CdTe detectors are widely used for the development of room temperature X-ray and gamma ray spectrometers. Typically, high resolution CdTe detectors are fabricated with blocking contacts (indium and aluminum) ensuring low leakage currents and high electric field for optimum charge collection. As well known, time instability under bias voltage (termed as polarization) is the major drawback of CdTe diode detectors. Polarization phenomena cause a progressive degradation of the spectroscopic performance with time, due to hole trapping and detrapping from deep acceptors levels. In this work, we studied the polarization phenomenon on new Al/p-CdTe/Pt detectors, manufactured by Acrorad (Japan), through electrical and spectroscopic approaches. In particular, we investigated on the time degradation of the spectroscopic response of the detectors at different temperatures, voltages and energies. Current transient measurements were also performed to better understand the properties of the deep acceptor levels and their correlation with the polarization effect.

  14. Worldwide distribution of Total Reflection X-ray Fluorescence instrumentation and its different fields of application: A survey

    Energy Technology Data Exchange (ETDEWEB)

    Klockenkämper, Reinhold, E-mail: reinhold.klockenkaemper@isas.de; Bohlen, Alex von

    2014-09-01

    A survey was carried out with users and manufacturers of Total Reflection X-ray Fluorescence instrumentation in order to demonstrate the worldwide distribution of TXRF equipment and the different fields of applications. In general, TXRF users come from universities and scientific institutes, from working places at synchrotron beam-lines, or laboratories in semiconductor fabs. TXRF instrumentation is distributed in more than 50 countries on six continents and is applied at about 200 institutes and laboratories. The number of running desktop instruments amounts to nearly 300 units. About 60 beamlines run working places dedicated to TXRF. About 300 floor-mounted instruments are estimated to be used in about 150 fabs of the semiconductor industry. In total, 13 different fields of applications could be registered statistically from three different aspects. - Highlights: • According to the survey world maps show the distribution of TXRF equipment. • Nearly 700 individual units are running actually in 57 countries of 6 continents. • Users work at 200 universities, 60 synchrotron-beamlines, and 150 semiconductor fabs. • 13 fields of applications (e.g. environmental, chemical) are evaluated statistically. • Manufacturers, conference members and authors lead to 3 different pie-charts.

  15. Detection limit calculations for different total reflection techniques

    International Nuclear Information System (INIS)

    Sanchez, H.J.

    2000-01-01

    In this work, theoretical calculations of detection limits for different total-reflection techniques are presented.. Calculations include grazing incidence (TXRF) and gracing exit (GEXRF) conditions. These calculations are compared with detection limits obtained for conventional x-ray fluorescence (XRF). In order to compute detection limits the Shiraiwa and Fujino's model to calculate x-ray fluorescence intensities was used. This model made certain assumptions and approximations to achieve the calculations, specially in the case of the geometrical conditions of the sample, and the incident and takeoff beams. Nevertheless the calculated data of detection limits for conventional XRF and total-reflection XRF show a good agreement with previous results. The model proposed here allows to analyze the different sources of background and the influence of the excitation geometry, which contribute to the understanding of the physical processes involved in the XRF analysis by total reflection. Finally, a comparison between detection limits in total-reflection analysis at grazing incidence and at grazing exit is carried out. Here a good agreement with the theoretical predictions of the reversibility principle is found, showing that detection limits are similar for both techniques. (author)

  16. Analysis of nutrition-relevant trace elements in human blood and serum by means of total reflection X-ray fluorescence (TXRF) spectroscopy

    International Nuclear Information System (INIS)

    Stosnach, Hagen; Mages, Margarete

    2009-01-01

    In clinical service laboratories, one of the most common analytical tasks with regard to inorganic traces is the determination of the nutrition-relevant elements Fe, Cu, Zn, and Se. Because of the high numbers of samples and the commercial character of these analyses, a time-consuming sample preparation must be avoided. In this presentation, the results of total reflection X-ray fluorescence measurements with a low-power system and different sample preparation procedures are compared with those derived from analysis with common methods like Atomic Absorption Spectroscopy (AAS) and Inductively Coupled Plasma Mass Spectroscopy (ICP-MS). The results of these investigations indicate that the optimal total reflection X-ray fluorescence analysis of the nutrition-relevant elements Fe, Cu, Zn, and Se can be performed by preparing whole blood and serum samples after dilution with ultrapure water and transferring 10 μl of internally standardized sample to an unsiliconized quartz glass sample carrier with subsequent drying in a laboratory oven. Suitable measurement time was found to be 600 s. The enhanced sample preparation by means of microwave or open digestion, in parts combined with cold plasma ashing, led to an improvement of detection limits by a factor of 2 for serum samples while for whole blood samples an improvement was only observed for samples prepared by means of microwave digestion. As the matrix elements P, S, Cl, and for whole blood Fe have a major influence on the detection limits, most probably a further enhancement of analytical quality requires the removal of the organic matrix. However, for the routine analysis of the nutrition-relevant elements, the dilution preparation was found to be sufficient.

  17. X-Ray Reflectivity from the Surface of a Liquid Crystal:

    DEFF Research Database (Denmark)

    Pershan, P.S.; Als-Nielsen, Jens Aage

    1984-01-01

    X-ray reflectivity from the surface of a nematic liquid crystal is interpreted as the coherent superposition of Fresnel reflection from the surface and Bragg reflection from smectic order induced by the surface. Angular dependence of the Fresnel effect yields information on surface structure....... Measurement of the intensity of diffuse critical scattering relative to the Fresnel reflection yields the absolute value of the critical part of the density-density correlation function....

  18. Obtaining high degree of circular polarization at X-ray FELs via a reverse undulator taper

    Energy Technology Data Exchange (ETDEWEB)

    Schneidmiller, E.A.; Yurkov, M.V.

    2013-08-15

    Baseline design of a typical X-ray FEL undulator assumes a planar configuration which results in a linear polarization of the FEL radiation. However, many experiments at X-ray FEL user facilities would profit from using a circularly polarized radiation. As a cheap upgrade one can consider an installation of a short helical (or cross-planar) afterburner, but then one should have an efficient method to suppress powerful linearly polarized background from the main undulator. In this paper we propose a new method for such a suppression: an application of the reverse taper in the main undulator. We discover that in a certain range of the taper strength, the density modulation (bunching) at saturation is practically the same as in the case of non-tapered undulator while the power of linearly polarized radiation is suppressed by orders of magnitude. Then strongly modulated electron beam radiates at full power in the afterburner. Considering SASE3 undulator of the European XFEL as a practical example, we demonstrate that soft X-ray radiation pulses with peak power in excess of 100 GW and an ultimately high degree of circular polarization can be produced. The proposed method is rather universal, i.e. it can be used at SASE FELs and seeded (self-seeded) FELs, with any wavelength of interest, in a wide range of electron beam parameters, and with any repetition rate. It can be used at different X-ray FEL facilities, in particular at LCLS after installation of the helical afterburner in the near future.

  19. Trace metal determinations by total-reflection x-ray fluorescence analysis in the open Atlantic Ocean

    International Nuclear Information System (INIS)

    Schmidt, D.; Gerwinski, W.; Radke, I.

    1993-01-01

    The Intergovernmental Oceanographic Commission (IOC), as a major component of its programme ''Global Investigation of Pollution in the Marine Environment'' (GIPME), maintains a long-standing project on ''Open Ocean Baseline Studies of Trace Contaminants''. Initially, the Atlantic Ocean and trace metals were selected. Four deep-water stations in the Cape Basin, Angola Basin, Cape Verde Abyssal Plain and Seine Abyssal Plain were regularly sampled for at least 36 depths. Additional samples were taken between stations. Samples were distributed to participants and a similar number of additional laboratories. As a central part of our own contribution to the project, we determined the trace heavy metals manganese, nickel, copper, zinc and lead and the lighter selenium by total-reflection X-ray fluorescence analysis. For the TXRF, the pre-enrichment of the trace metals and the separation from the salt matrix were performed by complexation with sodium dibenzyldithiocarbamate and reverse-phase chromatography. Generally, very low levels of trace elements were found in filtered and unfiltered water samples from these remote areas of the open Atlantic Ocean. Typical examples of the distributions of trace metal concentrations on depth profiles from the four deep-water stations as well as intercomparisons between the stations are presented. (author)

  20. Wave-optical evaluation of interference fringes and wavefront phase in a hard-x-ray beam totally reflected by mirror optics.

    Science.gov (United States)

    Yamauchi, Kazuto; Yamamura, Kazuya; Mimura, Hidekazu; Sano, Yasuhisa; Saito, Akira; Endo, Katsuyoshi; Souvorov, Alexei; Yabashi, Makina; Tamasaku, Kenji; Ishikawa, Tetsuya; Mori, Yuzo

    2005-11-10

    The intensity flatness and wavefront shape in a coherent hard-x-ray beam totally reflected by flat mirrors that have surface bumps modeled by Gaussian functions were investigated by use of a wave-optical simulation code. Simulated results revealed the necessity for peak-to-valley height accuracy of better than 1 nm at a lateral resolution near 0.1 mm to remove high-contrast interference fringes and appreciable wavefront phase errors. Three mirrors that had different surface qualities were tested at the 1 km-long beam line at the SPring-8/Japan Synchrotron Radiation Research Institute. Interference fringes faded when the surface figure was corrected below the subnanometer level to a spatial resolution close to 0.1 mm, as indicated by the simulated results.

  1. X-ray Reflected Spectra from Accretion Disk Models. III. A Complete Grid of Ionized Reflection Calculations

    Science.gov (United States)

    Garcia, J.; Dauser, T.; Reynolds, C. S.; Kallman, T. R.; McClintock, J. E.; Wilms, J.; Ekmann, W.

    2013-01-01

    We present a new and complete library of synthetic spectra for modeling the component of emission that is reflected from an illuminated accretion disk. The spectra were computed using an updated version of our code xillver that incorporates new routines and a richer atomic data base. We offer in the form of a table model an extensive grid of reflection models that cover a wide range of parameters. Each individual model is characterized by the photon index Gamma of the illuminating radiation, the ionization parameter zeta at the surface of the disk (i.e., the ratio of the X-ray flux to the gas density), and the iron abundance A(sub Fe) relative to the solar value. The ranges of the parameters covered are: 1.2 <= Gamma <= 3.4, 1 <= zeta <= 104, and 0.5 <= A(sub Fe) <= 10. These ranges capture the physical conditions typically inferred from observations of active galactic nuclei, and also stellar-mass black holes in the hard state. This library is intended for use when the thermal disk flux is faint compared to the incident power-law flux. The models are expected to provide an accurate description of the Fe K emission line, which is the crucial spectral feature used to measure black hole spin. A total of 720 reflection spectra are provided in a single FITS file suitable for the analysis of X-ray observations via the atable model in xspec. Detailed comparisons with previous reflection models illustrate the improvements incorporated in this version of xillver.

  2. A laboratory based x-ray reflectivity system

    International Nuclear Information System (INIS)

    Holt, S.A.; Creagh, D.C.; Jamie, I.M.; Dowling, T.L.; Brown, A.S.

    1996-01-01

    Full text: X-ray Reflectivity (XRR) over the last decade has proved to be a versatile and powerful technique by which the thickness of thin films, surface roughness and interface roughness can be determined. The systems amenable to study range from organic monolayers (liquid or solid substrates) to layered metal or semiconductor systems. Access to XRR has been limited by the requirement for synchrotron radiation sources. The development of XRR systems for the laboratory environment was pioneered by Weiss. An X-ray Reflectometer has been constructed by the Department of Physics (Australian Defence Force Academy) and the Research School of Chemistry (Australian National University). The general principles of the design were similar to those described by Weiss. The reflectometer is currently in the early stages of commissioning, with encouraging results thus far. The diffraction pattern of Mobil Catalytic Material (MCM), consisting primarily of SiO 2 . The poster will describe the reflectometer, its operation and present a summary of the most important results obtained to date

  3. X-ray optics and X-ray microscopes: new challenges

    International Nuclear Information System (INIS)

    Susini, J.

    2004-01-01

    Soon after the discovery of X-rays in 1895 by W. Roentgen, it became rapidly clear that the methods traditionally used in the visible light regime, namely refraction, diffraction and reflection were difficult to apply for X-ray optics. The physical origins of these difficulties are closely linked to the very nature of interaction of X-rays with matter. The small deviation δ of the refractive index of condensed matter from unity makes it difficult to extend refraction-based optics from the optical spectral region to the X-ray region because the refraction angle is proportional to δ. Similarly it is very challenging to extend diffraction-based focusing techniques to X-rays because the diffraction angle scales inversely with wavelength. Finally, the use of reflection-based optics is also limited by the very small critical angle for total reflection. All those fundamental limitations prevented for almost one century, the development of X-ray microscopy whereas electron microscopy became a standard tool. In the past twenty years, interests for X-ray microscopy revived, mainly because of several major advances in X-ray sources and X-ray optics. X-ray microscopy techniques are now emerging as powerful and complementary tools for submicron investigations. Soft X-ray microscopes offer traditionally the possibility to form direct images of thick hydrated biological material in near-native environment, at a spatial resolution well beyond that achievable with visible light microscopy. Natural contrast is available in the soft X-ray region, in the so-called ''water-window'', due to the presence of absorption edges of the major constituents (C,N,O). Recent advances in manufacturing techniques have enlarged the accessible energy range of micro-focussing optics and offer new applications in a broad range of disciplines. X-ray microscopy in the 1 - 30 keV energy range is better suited for fluorescence to map trace elements, tomography for 3D imaging and micro-diffraction. The

  4. Quantitative resonant soft x-ray reflectivity of ultrathin anisotropic organic layers: Simulation and experiment of PTCDA on Au

    International Nuclear Information System (INIS)

    Capelli, R.; Koshmak, K.; Giglia, A.; Mukherjee, S.; Nannarone, S.; Mahne, N.; Doyle, B. P.; Pasquali, L.

    2016-01-01

    Resonant soft X-ray reflectivity at the carbon K edge, with linearly polarized light, was used to derive quantitative information of film morphology, molecular arrangement, and electronic orbital anisotropies of an ultrathin 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) film on Au(111). The experimental spectra were simulated by computing the propagation of the electromagnetic field in a trilayer system (vacuum/PTCDA/Au), where the organic film was treated as an anisotropic medium. Optical constants were derived from the calculated (through density functional theory) absorption cross sections of the single molecule along the three principal molecular axes. These were used to construct the dielectric tensor of the film, assuming the molecules to be lying flat with respect to the substrate and with a herringbone arrangement parallel to the substrate plane. Resonant soft X-ray reflectivity proved to be extremely sensitive to film thickness, down to the single molecular layer. The best agreement between simulation and experiment was found for a film of 1.6 nm, with flat laying configuration of the molecules. The high sensitivity to experimental geometries in terms of beam incidence and light polarization was also clarified through simulations. The optical anisotropies of the organic film were experimentally determined and through the comparison with calculations, it was possible to relate them to the orbital symmetry of the empty electronic states.

  5. Quantitative resonant soft x-ray reflectivity of ultrathin anisotropic organic layers: Simulation and experiment of PTCDA on Au

    Energy Technology Data Exchange (ETDEWEB)

    Capelli, R.; Koshmak, K.; Giglia, A.; Mukherjee, S.; Nannarone, S. [IOM-CNR, s.s. 14, Km. 163.5 in AREA Science Park, Basovizza, 34149 Trieste (Italy); Mahne, N. [Elettra, s.s. 14, km 163.5 in AREA Science Park, Basovizza, 34149 Trieste (Italy); Doyle, B. P. [Department of Physics, University of Johannesburg, P.O. Box 524, Auckland Park 2006 (South Africa); Pasquali, L., E-mail: luca.pasquali@unimore.it [IOM-CNR, s.s. 14, Km. 163.5 in AREA Science Park, Basovizza, 34149 Trieste (Italy); Department of Physics, University of Johannesburg, P.O. Box 524, Auckland Park 2006 (South Africa); Dipartimento di Ingegneria “Enzo Ferrari,” Università di Modena e Reggio Emilia, Via Vignolese 905, 41125 Modena (Italy)

    2016-07-14

    Resonant soft X-ray reflectivity at the carbon K edge, with linearly polarized light, was used to derive quantitative information of film morphology, molecular arrangement, and electronic orbital anisotropies of an ultrathin 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) film on Au(111). The experimental spectra were simulated by computing the propagation of the electromagnetic field in a trilayer system (vacuum/PTCDA/Au), where the organic film was treated as an anisotropic medium. Optical constants were derived from the calculated (through density functional theory) absorption cross sections of the single molecule along the three principal molecular axes. These were used to construct the dielectric tensor of the film, assuming the molecules to be lying flat with respect to the substrate and with a herringbone arrangement parallel to the substrate plane. Resonant soft X-ray reflectivity proved to be extremely sensitive to film thickness, down to the single molecular layer. The best agreement between simulation and experiment was found for a film of 1.6 nm, with flat laying configuration of the molecules. The high sensitivity to experimental geometries in terms of beam incidence and light polarization was also clarified through simulations. The optical anisotropies of the organic film were experimentally determined and through the comparison with calculations, it was possible to relate them to the orbital symmetry of the empty electronic states.

  6. Polarization of X rays of multiply charged ions in dense high-temperature plasma

    NARCIS (Netherlands)

    Baronova, EO; Dolgov, AN; Yakubovskii, LK

    2004-01-01

    The development of a method for studying the features of X-ray emission by multiply charged ions in a dense hot plasma is considered. These features are determined by the radiation polarization phenomenon.

  7. Characterization of urban air pollution by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Schmeling, Martina

    2004-01-01

    Besides photochemical smog, particulate air pollution is a constantly growing problem in urban areas. The particulate matter present in pollution events contains often toxic or health impacting elements and is responsible for low visibility, might be triggering respiratory diseases like asthma, and can play an important role in formation or duration of smog events. To characterize particulate pollution in two different cities, samples were taken during intensive field campaigns in Chicago, IL, in 2002 and Phoenix, AZ, in 2001. Both cities experience regularly photochemical smog events as well as particulate pollution, but show very different meteorological and topographical conditions. Therefore it is expected that the particulate composition varies significantly, providing information about different pollution forms. Sampling took place in both cases at elevated locations and had a temporal resolution of 1.5 h and 1 h, respectively. The samples were analyzed by total reflection X-ray fluorescence after digestion of the filter matrix. As expected the elemental composition of particulate matter varied between both cities substantially with Phoenix showing a higher abundance of crustal elements, and Chicago enrichment in anthropogenically produced ones. In both cities diurnal patterns were found, exerting maxima in the morning and minima in the early afternoon. The diurnal pattern was much more regularly and also more strongly pronounced in Phoenix. Phoenix's valley location permits for a more stable nocturnal boundary layer to build up during the night thus trapping particulates efficiently during this time, until mixing occurs in the early morning hours and the residual layer lifts. In Chicago, the diurnal variation was less extreme, but another pattern determines the situation with the lake breeze. The lake breeze corresponds to a shift in wind direction towards the east, i.e. from Lake Michigan during the late morning. It was found that certain elemental species

  8. High quality multilayer mirrors for soft X-rays

    Energy Technology Data Exchange (ETDEWEB)

    Grimmer, H.; Boeni, P.; Breitmeier, U.; Clemens, D.; Horisberger, M. [Paul Scherrer Inst. (PSI), Villigen (Switzerland); Mertins, H.C.; Schaefers, F. [BESSY, Berlin (Germany)

    1997-09-01

    In an effort to develop optical components for X-rays with wavelengths in the water window (2.3 -4.4 nm) multilayer structures have been designed for the following applications: in transmission as phase shifters to change linear into circular polarization, in reflection as mirrors close to normal incidence and as linear polarizers at an angle of incidence of 45{sup o}. (author) 1 fig., 1 tab., 1 ref.

  9. Measured reflectance of graded multilayer mirrors designed for astronomical hard X-ray telescopes

    DEFF Research Database (Denmark)

    Christensen, Finn Erland; Craig, W.W.; Windt, D.L.

    2000-01-01

    Future astronomical X-ray telescopes, including the balloon-borne High-Energy Focusing Telescope (HEFT) and the Constellation-X Hard X-ray Telescope (Con-X HXT) plan to incorporate depth-graded multilayer coatings in order to extend sensitivity into the hard X-ray (10 less than or similar to E less......-graded W/Si multilayers optimized for broadband performance up to 69.5 keV (WK-edge). These designs are ideal for both the HEFT and Con-X HXT applications. We compare the measurements to model calculations to demonstrate that the reflectivity can be well described by the intended power law distribution...

  10. GaN quantum dot polarity determination by X-ray photoelectron diffraction

    Czech Academy of Sciences Publication Activity Database

    Romanyuk, Olexandr; Bartoš, Igor; Brault, J.; De Mierry, P.; Paskova, T.; Jiříček, Petr

    2016-01-01

    Roč. 389, Dec (2016), s. 1156-1160 ISSN 0169-4332 R&D Projects: GA ČR GA15-01687S; GA MŠk LM2015088 Institutional support: RVO:68378271 Keywords : GaN * semipolar GaN * quantum dots * X-ray photoelectron diffraction * surface polarity Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 3.387, year: 2016

  11. Surface induced smectic order in ionic liquids - an X-ray reflectivity study of [C22C1im]+[NTf2].

    Science.gov (United States)

    Mars, Julian; Hou, Binyang; Weiss, Henning; Li, Hailong; Konovalov, Oleg; Festersen, Sven; Murphy, Bridget M; Rütt, Uta; Bier, Markus; Mezger, Markus

    2017-10-11

    Surface induced smectic order was found for the ionic liquid 1-methyl-3-docosylimidazolium bis(trifluoromethlysulfonyl)imide by X-ray reflectivity and grazing incidence scattering experiments. Near the free liquid surface, an ordered structure of alternating layers composed of polar and non-polar moieties is observed. This leads to an oscillatory interfacial profile perpendicular to the liquid surface with a periodicity of 3.7 nm. Small angle X-ray scattering and polarized light microscopy measurements suggest that the observed surface structure is related to fluctuations into a metastable liquid crystalline SmA 2 phase that was found by supercooling the bulk liquid. The observed surface ordering persists up to 157 °C, i.e. more than 88 K above the bulk melting temperature of 68.1 °C. Close to the bulk melting point, we find a thickness of the ordered layer of L = 30 nm. The dependency of L(τ) = Λ ln(τ/τ 1 ) vs. reduced temperature τ follows a logarithmic growth law. In agreement with theory, the pre-factor Λ is governed by the correlation length of the isotropic bulk phase.

  12. Analysis of low Z elements in various environmental samples with total reflection X-ray fluorescence (TXRF) spectrometry

    International Nuclear Information System (INIS)

    Hoefler, H.; Streli, C.; Wobrauschek, P.; Ovari, M.; Zaray, Gy.

    2006-01-01

    Recently there is a growing interest in low Z elements such as carbon, oxygen up to sulphur and phosphorus in biological specimen. Total reflection X-ray fluorescence (TXRF) spectrometry is a suitable technique demanding only very small amounts of sample. On the other side, the detection of low Z elements is a critical point of this analytical technique. Besides other effects, self absorption may occur in the samples, because of the low energy of the fluorescence radiation. The calibration curves might be not linear any longer. To investigate this issue water samples and samples from human cerebrospinal fluid were used to examine absorption effects. The linearity of calibration curves in dependence of sample mass was investigated to verify the validity of the thin film approximation. The special requirements to the experimental setup for low Z energy dispersive fluorescence analysis were met by using the Atominstitute's TXRF vacuum chamber. This spectrometer is equipped with a Cr-anode X-ray tube, a multilayer monochromator and a SiLi detector with 30 mm 2 active area and with an ultrathin entrance window. Other object on this study are biofilms, living on all subaqueous surfaces, consisting of bacteria, algae and fungi embedded in their extracellular polymeric substances (EPS). Many trace elements from the water are bound in the biofilm. Thus, the biofilm is a useful indicator for polluting elements. For biomonitoring purposes not only the polluting elements but also the formation and growth rate of the biofilm are important. Biofilms were directly grown on TXRF reflectors. Their major elements and C-masses correlated to the cultivation time were investigated. These measured masses were related to the area seen by the detector, which was experimentally determined. Homogeneity of the biofilms was checked by measuring various sample positions on the reflectors

  13. Analysis of low Z elements in various environmental samples with total reflection X-ray fluorescence (TXRF) spectrometry

    Energy Technology Data Exchange (ETDEWEB)

    Hoefler, H. [Atominstitut of the Austrian Universities, TU-Wien, A-1020 Vienna (Austria); Streli, C. [Atominstitut of the Austrian Universities, TU-Wien, A-1020 Vienna (Austria)]. E-mail: streli@ati.ac.at; Wobrauschek, P. [Atominstitut of the Austrian Universities, TU-Wien, A-1020 Vienna (Austria); Ovari, M. [Eoetvoes University, Institute of Chemistry, H-1117, Budapest, Pazmany P. stny 1/a. (Hungary); Zaray, Gy. [Eoetvoes University, Institute of Chemistry, H-1117, Budapest, Pazmany P. stny 1/a. (Hungary)

    2006-11-15

    Recently there is a growing interest in low Z elements such as carbon, oxygen up to sulphur and phosphorus in biological specimen. Total reflection X-ray fluorescence (TXRF) spectrometry is a suitable technique demanding only very small amounts of sample. On the other side, the detection of low Z elements is a critical point of this analytical technique. Besides other effects, self absorption may occur in the samples, because of the low energy of the fluorescence radiation. The calibration curves might be not linear any longer. To investigate this issue water samples and samples from human cerebrospinal fluid were used to examine absorption effects. The linearity of calibration curves in dependence of sample mass was investigated to verify the validity of the thin film approximation. The special requirements to the experimental setup for low Z energy dispersive fluorescence analysis were met by using the Atominstitute's TXRF vacuum chamber. This spectrometer is equipped with a Cr-anode X-ray tube, a multilayer monochromator and a SiLi detector with 30 mm{sup 2} active area and with an ultrathin entrance window. Other object on this study are biofilms, living on all subaqueous surfaces, consisting of bacteria, algae and fungi embedded in their extracellular polymeric substances (EPS). Many trace elements from the water are bound in the biofilm. Thus, the biofilm is a useful indicator for polluting elements. For biomonitoring purposes not only the polluting elements but also the formation and growth rate of the biofilm are important. Biofilms were directly grown on TXRF reflectors. Their major elements and C-masses correlated to the cultivation time were investigated. These measured masses were related to the area seen by the detector, which was experimentally determined. Homogeneity of the biofilms was checked by measuring various sample positions on the reflectors.

  14. Optimization of a polarized source for in vivo x-ray fluorescence analysis of platinum and other heavy metals

    International Nuclear Information System (INIS)

    Lewis, D.G.

    1994-01-01

    The Monte Carlo method was used to optimize a polarized photon source for the x-ray fluorescence analysis of platinum and other heavy metals in vivo. The source consisted of a 140 kVp, 25 mA x-ray tube with the photons plane-polarized by 90 o scattering. The use of plane-polarized photons results in a significant reduction in background when the fluorescent radiation is measured along the direction of polarization. A Monte Carlo computer programme was written to simulate the production and interaction of polarized photons in order to determine the optimal polarizing material and dimensions, together with beam width and geometrical arrangement of source, polarizer and beam collimators. Calculated photon energy distributions are compared with experimental data to test the validity of the model. (author)

  15. The single reflection regime of X-rays travelling into a monocapillary

    International Nuclear Information System (INIS)

    Dabagov, S.B.; Marcelli, A.

    1999-01-01

    In this manuscript an analysis of the transmission of x-rays through a single monocapillary under the single reflection regime is presented and discussed. Because ray tracing does not allow to explain the experimental data, a first qualitative interpretation of the observed behavior is given in the framework of the wave theory

  16. Perfect-crystal x-ray optics to treat x-ray coherence

    International Nuclear Information System (INIS)

    Yamazaki, Hiroshi; Ishikawa, Tetsuya

    2007-01-01

    X-ray diffraction of perfect crystals, which serve as x-ray monochromator and collimator, modifies coherence properties of x-ray beams. From the time-dependent Takagi-Taupin equations that x-ray wavefields obey in crystals, the reflected wavefield is formulated as an integral transform of a general incident wavefield with temporal and spatial inhomogeneity. A reformulation of rocking-curve profiles from the field solution of the Takagi-Taupin equations allows experimental evaluation of the mutual coherence function of x-ray beam. The rigorous relationship of the coherence functions between before and after reflection clarifies how the coherence is transferred by a crystal. These results will be beneficial to developers of beamline optics for the next generation synchrotron sources. (author)

  17. Further comments on the effects of vacuum birefringence on the polarization of X-rays emitted from magnetic neutron stars

    Science.gov (United States)

    Chanan, G. A.; Novick, R.; Silver, E. H.

    1979-01-01

    The birefringence of the vacuum in the presence of strong (of the order of 1 teragauss) magnetic fields will in general affect the polarization of X-rays propagating through these fields. Two of the four Stokes parameters will vary so rapidly with wavelength as to be 'washed out' and unobservable, but the remaining two parameters will be unaffected. These results show that one conclusion of an earlier work is incorrect: Polarized X-ray emission from the surface of a magnetic neutron star will not in general be completely depolarized by the effects of vacuum birefringence. In particular, this birefringence has no effect on the linear polarization of cyclotron emission from the poles of magnetic neutron stars, and a similar result holds for synchrotron emission. More general cases of the propagation of polarized X-rays in magnetic fields are also discussed.

  18. Angular distribution coefficients for γ-ray polarization produced in polarized capture reactions

    International Nuclear Information System (INIS)

    Wulf, E.A.; Guillemette, J.; Weller, H.R.; Seyler, R.G.

    1999-01-01

    The previous publications have dealt with the angular momentum formalism of both linear and circularly polarized photons in (γ, x) reactions on both polarized and unpolarized targets, and the inverse (capture) reactions initiated by polarized beams. In the present work, utilizing the general formalism of Welton, the authors deal with the linear polarization of the γ-rays which are produced in capture reactions on unpolarized targets, including the possibility of having incident polarized spin 1/2 projectiles. These capture reactions are denoted by a(rvec x, rvec L)c, where rvec x is the incident polarized spin 1/2 projectile and rvec L represents the outgoing polarized γ-ray. They present here the formalism in a convenient form, display a sample table of coefficients, and illustrate its use by means of several examples. A FORTRAN code will be made available for generating similar coefficients for other reactions

  19. Total reflection X-ray spectroscopy as a rapid analytical method for uranium determination in drainage water

    International Nuclear Information System (INIS)

    Matsuyama, Tsugufumi; Sakai, Yasuhiro; Izumoto, Yukie; Imaseki, Hitoshi; Hamano, Tsuyoshi; Yoshii, Hiroshi

    2017-01-01

    Uranium concentrations in drainage water are typically determined by α-spectrometry. However, due to the low specific radioactivity of uranium, the evaporation of large volumes of drainage water, followed by several hours of measurements, is required. Thus, the development of a rapid and simple detection method for uranium in drainage water would enhance the operation efficiency of radiation control workers. We herein propose a novel methodology based on total reflection X-ray fluorescence (TXRF) for the measurement of uranium in contaminated water. TXRF is a particularly desirable method for the rapid and simple evaluation of uranium in contaminated water, as chemical pretreatment of the sample solution is not necessary, measurement times are typically several seconds, and the required sample volume is low. We herein employed sample solutions containing several different concentrations of uranyl acetate with yttrium as an internal standard. The solutions were placed onto sample holders, and were dried prior to TXRF measurements. The relative intensity, otherwise defined as the net intensity ratio of the Lα peak of uranium to the Kα peak of yttrium, was directly proportional to the uranium concentration. Using this method, a TXRF detection limit for uranium in contaminated water of 0.30 μg/g was achieved. (author)

  20. Comptonization of low-frequency radiation in accretion disks Angular distribution and polarization of hard X-ray radiation

    International Nuclear Information System (INIS)

    Suniaev, R.A.; Titarchuk, L.G.

    1984-01-01

    Analytical consideration is given to the comptonization of photons and its effects on the radiation emitted from accretion disks of compact X-ray sources, such as black holes and neutron stars. Attention is given to the photon distribution during escape from the disk, the angular distribution of hard radiation from the disk, the polarization of hard radiation and the electron temperature distribution over the optical depth. It is shown that the hard radiation spectrum is independent of the low-frequency photon source distribution. The angular distribution and polarization of the outgoing X-rays are a function of the optical depth. A Thomson approximation is used to estimate the angular distribution of the hard radiation and the polarization over the disk. The polarization results are compared with OSO-8 satellite data for Cyg X-1 and show good agreement at several energy levels. 17 references

  1. Transforming Our Understanding of the X-ray Universe: The Imaging X-ray Polarimeter Explorer (IXPE)

    Science.gov (United States)

    Weisskopf, Martin C.; Bellazzini, Ronaldo; Costa, Enrico; Matt, Giorgio; Marshall, Herman; ODell, Stephen L.; Pavlov, George; Ramsey, Brian; Romani, Roger

    2014-01-01

    Accurate X-ray polarimetry can provide unique information on high-energy-astrophysical processes and sources. As there have been no meaningful X-ray polarization measurements of cosmic sources since our pioneering work in the 1970's, the time is ripe to explore this new parameter space in X-ray astronomy. To accomplish this requires a well-calibrated and well understood system that-particularly for an Explorer mission-has technical, cost, and schedule credibility. The system that we shall present satisfies these conditions, being based upon completely calibrated imaging- and polarization-sensitive detectors and proven X-ray-telescope technology.

  2. Spin-polarized x-ray emission of 3d transition-metal ions : A comparison via K alpha and K beta detection

    NARCIS (Netherlands)

    Wang, Xin; deGroot, F.M.F.; Cramer, SP

    1997-01-01

    This paper demonstrates that spin-polarized x-ray-excitation spectra can be obtained using K alpha emission as well as K beta lines. A spin-polarized analysis of K alpha x-ray emission and the excitation spectra by K alpha detection on a Ni compound is reported. A systematic analysis of the

  3. Calculated Performance Of The Variable-Polarization Undulator Upgrade To The Daresbury SRS Soft X-Ray Undulator Beamline

    International Nuclear Information System (INIS)

    Roper, Mark D.; Bird, Daniel T.

    2004-01-01

    The soft x-ray beamline 5U1 on the Daresbury Laboratory SRS currently uses a planar undulator, producing linearly polarized radiation in the range 100 to 1000 eV. The undulator is soon to be replaced by a variable-polarization device of the Apple II design. The aim is to produce circularly polarized light in the energy range 265 to 1000 eV, covering the K-edges of C, N and O, and the first row transition element L-edges. This will greatly enhance the provision of circularly polarized soft-x-rays on the SRS and open up new opportunities for experimenters. The device will also produce linear polarization with a selectable angle of polarization with respect to the orbit plane, which is currently unavailable on the SRS. In order to provide the coverage over this energy range, we are exploiting the relatively large emittance of the SRS to allow us to use the second and third harmonics even in circular polarization mode. This paper presents the expected beamline output in various polarization modes and the predicted degree of polarization

  4. Total number albedo and average cosine of the polar angle of low-energy photons reflected from water

    Directory of Open Access Journals (Sweden)

    Marković Srpko

    2007-01-01

    Full Text Available The total number albedo and average cosine of the polar angle for water and initial photon energy range from 20 keV to 100 keV are presented in this pa per. A water shield in the form of a thick, homogenous plate and per pendicular incidence of the monoenergetic photon beam are assumed. The results were obtained through Monte Carlo simulations of photon reflection by means of the MCNP computer code. Calculated values for the total number albedo were compared with data previously published and good agreement was confirmed. The dependence of the average cosine of the polar angle on energy is studied in detail. It has been found that the total average cosine of the polar angle has values in the narrow interval of 0.66-0.67, approximately corresponding to the reflection angle of 48°, and that it does not depend on the initial photon energy.

  5. Determination of arsenic in water samples by Total Reflection X-Ray Fluorescence using pre-concentration with alumina

    Energy Technology Data Exchange (ETDEWEB)

    Barros, Haydn [Laboratorio de Fisica Nuclear, Dpto. De Fisica, Universidad Simon Bolivar, Sartenejas, Baruta (Venezuela, Bolivarian Republic of); Marco Parra, Lue-Meru, E-mail: luemerumarco@yahoo.e [Universidad Centroccidental Lisandro Alvarado, Dpto. Quimica y Suelos, Decanato de Agronomia, Tarabana, Cabudare, Edo.Lara (Venezuela, Bolivarian Republic of); Bennun, Leonardo [Universidad de Concepcion, Concepcion (Chile); Greaves, Eduardo D. [Laboratorio de Fisica Nuclear, Dpto. De Fisica, Universidad Simon Bolivar, Sartenejas, Baruta (Venezuela, Bolivarian Republic of)

    2010-06-15

    The determination of arsenic in water samples requires techniques of high sensitivity. Total Reflection X-Ray Fluorescence (TXRF) allows the determination but a prior separation and pre-concentration procedure is necessary. Alumina is a suitable substrate for the selective separation of the analytes. A method for separation and pre-concentration in alumina, followed by direct analysis of the alumina is evaluated. Quantification was performed using the Al-K{alpha} and Co-K{alpha} lines as internal standard in samples prepared on an alumina matrix, and compared to a calibration with aqueous standards. Artificial water samples of As (III) and As (V) were analyzed after the treatment. Fifty milliliters of the sample at ppb concentration levels were mixed with 10 mg of alumina. The pH, time and temperature were controlled. The alumina was separated from the slurry by centrifugation, washed with de-ionized water and analyzed directly on the sample holder. A pre-concentration factor of 100 was found, with detection limit of 0.7 {mu}gL{sup -1}. The percentage of recovery was 98% for As (III) and 95% for As (V) demonstrating the suitability of the procedure.

  6. Determination of arsenic in water samples by Total Reflection X-Ray Fluorescence using pre-concentration with alumina

    International Nuclear Information System (INIS)

    Barros, Haydn; Marco Parra, Lue-Meru; Bennun, Leonardo; Greaves, Eduardo D.

    2010-01-01

    The determination of arsenic in water samples requires techniques of high sensitivity. Total Reflection X-Ray Fluorescence (TXRF) allows the determination but a prior separation and pre-concentration procedure is necessary. Alumina is a suitable substrate for the selective separation of the analytes. A method for separation and pre-concentration in alumina, followed by direct analysis of the alumina is evaluated. Quantification was performed using the Al-Kα and Co-Kα lines as internal standard in samples prepared on an alumina matrix, and compared to a calibration with aqueous standards. Artificial water samples of As (III) and As (V) were analyzed after the treatment. Fifty milliliters of the sample at ppb concentration levels were mixed with 10 mg of alumina. The pH, time and temperature were controlled. The alumina was separated from the slurry by centrifugation, washed with de-ionized water and analyzed directly on the sample holder. A pre-concentration factor of 100 was found, with detection limit of 0.7 μgL -1 . The percentage of recovery was 98% for As (III) and 95% for As (V) demonstrating the suitability of the procedure.

  7. Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

    Directory of Open Access Journals (Sweden)

    Yoshikazu Fujii

    2013-01-01

    Full Text Available X-ray reflectometry is a powerful tool for investigations on rough surface and interface structures of multilayered thin film materials. The X-ray reflectivity has been calculated based on the Parratt formalism, accounting for the effect of roughness by the theory of Nevot-Croce conventionally. However, in previous studies, the calculations of the X-ray reflectivity often show a strange effect where interference effects would increase at a rough surface. And estimated surface and interface roughnesses from the X-ray reflectivity measurements did not correspond to the TEM image observation results. The strange result had its origin in a used equation due to a serious mistake in which the Fresnel transmission coefficient in the reflectivity equation is increased at a rough interface because of a lack of consideration of diffuse scattering. In this review, a new accurate formalism that corrects this mistake is presented. The new accurate formalism derives an accurate analysis of the X-ray reflectivity from a multilayer surface of thin film materials, taking into account the effect of roughness-induced diffuse scattering. The calculated reflectivity by this accurate reflectivity equation should enable the structure of buried interfaces to be analyzed more accurately.

  8. Radiation parameters of the X-ray binary A 0535+26=HDE 245770 from the polarization and photometric data

    International Nuclear Information System (INIS)

    Larionov, V.M.

    1987-01-01

    An analysis of Shakhovskay et al's observations of the X-ray binary A 0535+26=HDE 245770 made it possible to distinguish in its radiation the two components connected with the visible star (O9 III) and the accretion disc around the neutron star. The interstellar polarization parameters are in accordance with Serkowski's formula and the observations of the field stars. The IR and optical variability can be explained in terms of variable accretion disc radiation. The intrinsic polarization parameters obtained can be used to predict, in the model proposed, the directions of the polarization vectors in the IR and X-ray bands

  9. Soft x-ray resonant magnetic powder diffraction on PrNiO{sub 3}

    Energy Technology Data Exchange (ETDEWEB)

    Staub, U [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); GarcIa-Fernandez, M [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); Mulders, A M [Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth WA 6845 (Australia); Bodenthin, Y [Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland); MartInez-Lope, M J [Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid (Spain); Alonso, J A [Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid (Spain)

    2007-03-07

    We report on the first soft x-ray resonant powder diffraction experiments performed at the Ni L{sub 2,3} edges of PrNiO{sub 3}. The temperature, polarization and energy dependence of the (1/2 0 1/2) reflection indicates a magnetic origin for the signal. This experiment demonstrates that x-ray resonant magnetic powder diffraction can be relatively easily performed in the soft x-ray regime due to the very large enhancement factors at the absorption edges. Such experiments allow us to extract important information on the electronic states of the d shell. Similar results can be anticipated from orbital reflections measured in a powder. (fast track communication)

  10. Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications

    Energy Technology Data Exchange (ETDEWEB)

    Huang, Xian-Rong; Gog, Thomas; Kim, Jungho; Kasman, Elina; Said, Ayman H.; Casa, Diego M.; Wieczorek, Michael; Hönnicke, Marcelo G.; Assoufid, Lahsen

    2018-02-01

    Quartz has hundreds of strong Bragg reflections that may offer a great number of choices for making fixed-angle X-ray analyzers and polarizers at virtually any hard X-ray energies with selectable resolution. However, quartz crystals, unlike silicon and germanium, are chiral and may thus appear in two different forms of handedness that are mirror images. Furthermore, because of the threefold rotational symmetry along thecaxis, the {h1h2h3L} and {h2h1h3L} Bragg reflections may have quite different Darwin bandwidth, reflectivity and angular acceptance, although they have the same Bragg angle. The design of X-ray optics from quartz crystals therefore requires unambiguous determination of the orientation, handedness and polarity of the crystals. The Laue method and single-axis diffraction technique can provide such information, but the variety of conventions used in the literature to describe quartz structures has caused widespread confusion. The current studies give detailed guidelines for design and fabrication of quartz X-ray optics, with special emphasis on the correct interpretation of Laue patterns in terms of the crystallography and diffraction properties of quartz. Meanwhile, the quartz crystals examined were confirmed by X-ray topography to have acceptably low densities of dislocations and other defects, which is the foundation for developing high-resolution quartz-based X-ray optics.

  11. Cr/B{sub 4}C multilayer mirrors: Study of interfaces and X-ray reflectance

    Energy Technology Data Exchange (ETDEWEB)

    Burcklen, C.; Meltchakov, E.; Jérome, A.; Rossi, S. de; Delmotte, F. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Soufli, R. [Laboratoire Charles Fabry, Institut d' Optique Graduate School, CNRS, Université Paris-Saclay, 91127 Palaiseau Cedex (France); Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550 (United States); Dennetiere, D.; Polack, F.; Capitanio, B.; Thomasset, M. [Synchrotron SOLEIL, L' Orme des Merisiers, Saint Aubin, BP 48F-91192 Gif sur Yvette Cedex (France); Gullikson, E. [Center for X-ray Optics, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)

    2016-03-28

    We present an experimental study of the effect of layer interfaces on the x-ray reflectance in Cr/B{sub 4}C multilayer interference coatings with layer thicknesses ranging from 0.7 nm to 5.4 nm. The multilayers were deposited by magnetron sputtering and by ion beam sputtering. Grazing incidence x-ray reflectometry, soft x-ray reflectometry, and transmission electron microscopy reveal asymmetric multilayer structures with a larger B{sub 4}C-on-Cr interface, which we modeled with a 1–1.5 nm thick interfacial layer. Reflectance measurements in the vicinity of the Cr L{sub 2,3} absorption edge demonstrate fine structure that is not predicted by simulations using the currently tabulated refractive index (optical constants) values for Cr.

  12. X-ray reflectivity measurements of liquid/solid interfaces under high hydrostatic pressure conditions.

    Science.gov (United States)

    Wirkert, Florian J; Paulus, Michael; Nase, Julia; Möller, Johannes; Kujawski, Simon; Sternemann, Christian; Tolan, Metin

    2014-01-01

    A high-pressure cell for in situ X-ray reflectivity measurements of liquid/solid interfaces at hydrostatic pressures up to 500 MPa (5 kbar), a pressure regime that is particularly important for the study of protein unfolding, is presented. The original set-up of this hydrostatic high-pressure cell is discussed and its unique properties are demonstrated by the investigation of pressure-induced adsorption of the protein lysozyme onto hydrophobic silicon wafers. The presented results emphasize the enormous potential of X-ray reflectivity studies under high hydrostatic pressure conditions for the in situ investigation of adsorption phenomena in biological systems.

  13. Center for X-Ray Optics, 1992

    International Nuclear Information System (INIS)

    1993-08-01

    This report discusses the following topics: Center for X-Ray Optics; Soft X-Ray Imaging wit Zone Plate Lenses; Biological X-Ray microscopy; Extreme Ultraviolet Lithography for Nanoelectronic Pattern Transfer; Multilayer Reflective Optics; EUV/Soft X-ray Reflectometer; Photoemission Microscopy with Reflective Optics; Spectroscopy with Soft X-Rays; Hard X-Ray Microprobe; Coronary Angiography; and Atomic Scattering Factors

  14. X-ray polarization fluctuations induced by cloud eclipses in active galactic nuclei

    Czech Academy of Sciences Publication Activity Database

    Marin, Frederic; Dovčiak, Michal

    2015-01-01

    Roč. 573, January (2015), A60/1-A60/8 ISSN 0004-6361 R&D Projects: GA MŠk LD12010 Grant - others:EU(XE) COST action MP1104 Institutional support: RVO:67985815 Keywords : galaxies: Seyfert * polarization * radiative transfer * relativistic processes * scattering * X-rays: general Subject RIV: BN - Astronomy, Celestial Mechanics, Astrophysics Impact factor: 4.378, year: 2014

  15. Theoretical analysis of the background intensity distribution in X-ray Birefringence Imaging using synchrotron bending-magnet radiation

    Science.gov (United States)

    Sutter, John P.; Dolbnya, Igor P.; Collins, Stephen P.; Harris, Kenneth D. M.; Edwards-Gau, Gregory R.; Palmer, Benjamin A.

    2015-04-01

    In the recently developed technique of X-ray Birefringence Imaging, molecular orientational order in anisotropic materials is studied by exploiting the birefringence of linearly polarized X-rays with energy close to an absorption edge of an element in the material. In the experimental setup, a vertically deflecting high-resolution double-crystal monochromator is used upstream from the sample to select the appropriate photon energy, and a horizontally deflecting X-ray polarization analyzer, consisting of a perfect single crystal with a Bragg reflection at Bragg angle of approximately 45°, is placed downstream from the sample to measure the resulting rotation of the X-ray polarization. However, if the experiment is performed on a synchrotron bending-magnet beamline, then the elliptical polarization of the X-rays out of the electron orbit plane affects the shape of the output beam. Also, because the monochromator introduces a correlation between vertical position and photon energy to the X-ray beam, the polarization analyzer does not select the entire beam, but instead selects a diagonal stripe, the slope of which depends on the Bragg angles of the monochromator and the polarization analyzer. In the present work, the final background intensity distribution is calculated analytically because the phase space sampling methods normally used in ray traces are too inefficient for this setup. X-ray Birefringence Imaging data measured at the Diamond Light Source beamline B16 agree well with the theory developed here.

  16. Theoretical analysis of the background intensity distribution in X-ray Birefringence Imaging using synchrotron bending-magnet radiation

    Energy Technology Data Exchange (ETDEWEB)

    Sutter, John P., E-mail: john.sutter@diamond.ac.uk; Dolbnya, Igor P.; Collins, Stephen P. [Diamond Light Source Ltd., Chilton, Didcot, Oxfordshire OX11 0DE (United Kingdom); Harris, Kenneth D. M.; Edwards-Gau, Gregory R. [School of Chemistry, Cardiff University, Park Place, Cardiff CF10 3AT, Wales (United Kingdom); Palmer, Benjamin A. [Department of Structural Biology, Weizmann Institute of Science, 234 Herzl St., Rehovot 7610001 (Israel)

    2015-04-28

    In the recently developed technique of X-ray Birefringence Imaging, molecular orientational order in anisotropic materials is studied by exploiting the birefringence of linearly polarized X-rays with energy close to an absorption edge of an element in the material. In the experimental setup, a vertically deflecting high-resolution double-crystal monochromator is used upstream from the sample to select the appropriate photon energy, and a horizontally deflecting X-ray polarization analyzer, consisting of a perfect single crystal with a Bragg reflection at Bragg angle of approximately 45°, is placed downstream from the sample to measure the resulting rotation of the X-ray polarization. However, if the experiment is performed on a synchrotron bending-magnet beamline, then the elliptical polarization of the X-rays out of the electron orbit plane affects the shape of the output beam. Also, because the monochromator introduces a correlation between vertical position and photon energy to the X-ray beam, the polarization analyzer does not select the entire beam, but instead selects a diagonal stripe, the slope of which depends on the Bragg angles of the monochromator and the polarization analyzer. In the present work, the final background intensity distribution is calculated analytically because the phase space sampling methods normally used in ray traces are too inefficient for this setup. X-ray Birefringence Imaging data measured at the Diamond Light Source beamline B16 agree well with the theory developed here.

  17. Interaction between lipid monolayers and poloxamer 188: An X-ray reflectivity and diffraction study

    DEFF Research Database (Denmark)

    Wu, G.H.; Majewski, J.; Ege, C.

    2005-01-01

    The mechanism by which poloxamer 188 (P188) seals a damaged cell membrane is examined using the lipid monolayer as a model system. X-ray reflectivity and grazing-incidence x-ray diffraction results show that at low nominal lipid density, P188, by physically occupying the available area and phase ...

  18. Optimizing total reflection X-ray fluorescence for direct trace element quantification in proteins I: Influence of sample homogeneity and reflector type

    Science.gov (United States)

    Wellenreuther, G.; Fittschen, U. E. A.; Achard, M. E. S.; Faust, A.; Kreplin, X.; Meyer-Klaucke, W.

    2008-12-01

    Total reflection X-ray fluorescence (TXRF) is a very promising method for the direct, quick and reliable multi-elemental quantification of trace elements in protein samples. With the introduction of an internal standard consisting of two reference elements, scandium and gallium, a wide range of proteins can be analyzed, regardless of their salt content, buffer composition, additives and amino acid composition. This strategy also enables quantification of matrix effects. Two potential issues associated with drying have been considered in this study: (1) Formation of heterogeneous residues of varying thickness and/or density; and (2) separation of the internal standard and protein during drying (which has to be prevented to allow accurate quantification). These issues were investigated by microbeam X-ray fluorescence (μXRF) with special emphasis on (I) the influence of sample support and (II) the protein / buffer system used. In the first part, a model protein was studied on well established sample supports used in TXRF, PIXE and XRF (Mylar, siliconized quartz, Plexiglas and silicon). In the second part we imaged proteins of different molecular weight, oligomerization state, bound metals and solubility. A partial separation of protein and internal standard was only observed with untreated silicon, suggesting it may not be an adequate support material. Siliconized quartz proved to be the least prone to heterogeneous drying of the sample and yielded the most reliable results.

  19. Optimizing total reflection X-ray fluorescence for direct trace element quantification in proteins I: Influence of sample homogeneity and reflector type

    Energy Technology Data Exchange (ETDEWEB)

    Wellenreuther, G. [European Molecular Biology Laboratory, Notkestr. 85, 22603 Hamburg (Germany); Fittschen, U.E.A. [Department of Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, 20146 Hamburg (Germany); Achard, M.E.S.; Faust, A.; Kreplin, X. [European Molecular Biology Laboratory, Notkestr. 85, 22603 Hamburg (Germany); Meyer-Klaucke, W. [European Molecular Biology Laboratory, Notkestr. 85, 22603 Hamburg (Germany)], E-mail: Wolfram@embl-hamburg.de

    2008-12-15

    Total reflection X-ray fluorescence (TXRF) is a very promising method for the direct, quick and reliable multi-elemental quantification of trace elements in protein samples. With the introduction of an internal standard consisting of two reference elements, scandium and gallium, a wide range of proteins can be analyzed, regardless of their salt content, buffer composition, additives and amino acid composition. This strategy also enables quantification of matrix effects. Two potential issues associated with drying have been considered in this study: (1) Formation of heterogeneous residues of varying thickness and/or density; and (2) separation of the internal standard and protein during drying (which has to be prevented to allow accurate quantification). These issues were investigated by microbeam X-ray fluorescence ({mu}XRF) with special emphasis on (I) the influence of sample support and (II) the protein / buffer system used. In the first part, a model protein was studied on well established sample supports used in TXRF, PIXE and XRF (Mylar, siliconized quartz, Plexiglas and silicon). In the second part we imaged proteins of different molecular weight, oligomerization state, bound metals and solubility. A partial separation of protein and internal standard was only observed with untreated silicon, suggesting it may not be an adequate support material. Siliconized quartz proved to be the least prone to heterogeneous drying of the sample and yielded the most reliable results.

  20. X-ray microscopy using grazing-incidence reflections optics

    International Nuclear Information System (INIS)

    Price, R.H.

    1983-01-01

    The role of Kirkpatrick-Baez microscopes as the workhorse of the x-ray imaging devices is discussed. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

  1. Energy dispersive X-ray fluorescence analysis with multiple total reflection

    International Nuclear Information System (INIS)

    Freitag, K.

    1985-01-01

    The development of a total reflection XRF analyzer and the performance data of this instrument are described. The drastic reduction of the scattered radiation is the outstanding property of the method. Detection limits of elements and matrix effects are discussed. The competition with other methods of analysis has proven its advantages in a wide range. In addition to its multi-element features down to the picogram level, particularly its universal calibration function has turned out to be a great help in the analytical practice. (orig./RB)

  2. Polarity effects in the x-ray photoemission of ZnO and other wurtzite semiconductors

    International Nuclear Information System (INIS)

    Allen, M. W.; Zemlyanov, D. Y.; Waterhouse, G. I. N.; Metson, J. B.; Veal, T. D.; McConville, C. F.; Durbin, S. M.

    2011-01-01

    Significant polarity-related effects were observed in the near-surface atomic composition and valence band electronic structure of ZnO single crystals, investigated by x-ray photoemission spectroscopy using both Al K α (1486.6 eV) and synchrotron radiation (150 to 1486 eV). In particular, photoemission from the lowest binding energy valence band states was found to be significantly more intense on the Zn-polar face compared to the O-polar face. This is a consistent effect that can be used as a simple, nondestructive indicator of crystallographic polarity in ZnO and other wurtzite semiconductors.

  3. X-ray Pulse Length Characterization using the Surface Magneto Optic Kerr Effect

    International Nuclear Information System (INIS)

    Krejcik, P.; SLAC

    2006-01-01

    It will be challenging to measure the temporal profile of the hard X-ray SASE beam independently from the electron beam in the LCLS and other 4th generation light sources. A fast interaction mechanism is needed that can be probed by an ultrafast laser pulse in a pump-probe experiment. It is proposed to exploit the rotation in polarization of light reflected from a thin magnetized film, known as the surface magneto optic Kerr effect (SMOKE), to witness the absorption of the x-ray pulse in the thin film. The change in spin orbit coupling induced by the x-ray pulse occurs on the subfemtosecond time scale and changes the polarization of the probe beam. The limitation to the technique lies with the bandwidth of the probe laser pulse and how short the optical pulse can be made. The SMOKE mechanism will be described and the choices of materials for use with 1.5 (angstrom) x-rays. A schematic description of the pump-probe geometry for x-ray diagnosis is also described

  4. X-ray microscopy using grazing-incidence reflection optics

    International Nuclear Information System (INIS)

    Price, R.H.

    1981-01-01

    The Kirkpatrick-Baez microscopes are described along with their role as the workhorse of the x-ray imaging devices. This role is being extended with the development of a 22X magnification Kirkpatrick-Baez x-ray microscope with multilayer x-ray mirrors. These mirrors can operate at large angles, high x-ray energies, and have a narrow, well defined x-ray energy bandpass. This will make them useful for numerous experiments. However, where a large solid angle is needed, the Woelter microscope will still be necessary and the technology needed to build them will be useful for many other types of x-ray optics

  5. Accretion dynamics and polarized x-ray emission of magnetized neutron stars

    International Nuclear Information System (INIS)

    Arons, J.

    1991-01-01

    The basic ideas of accretion onto magnetized neutron stars are outlined. These are applied to a simple model of the structure of the plasma mound sitting at the magnetic poles of such as star, in which upward diffusion of photons is balanced by their downward advection. This steady flow model of the plasma's dynamical state is used to compute the emission of polarized X-rays from the optically thick, birefringent medium. The linear polarization of the continuum radiation emerging from the quasi-static mound is found to be as much as 40% at some rotation phases, but is insensitive to the geometry of the accretion flow. The role of the accretion shock, whose detailed polarimetric and spectral characteristics have yet to be calculated, is emphasized as the final determinant of the properties of the emerging X-rays. Some results describing the fully time dependent dynamics of the flow are also presented. In particular, steady flow onto a neutron star is shown to exhibit formation of ''photon bubbles,'' regions of greatly reduced plasma density filled with radiation which form and rise on millisecond time scales. The possible role of these complex structures in the flow for the formation of the emergent spectrum is briefly outlined

  6. Chromatic X-ray magnifying method and apparatus by Bragg reflective planes on the surface of Abbe sphere

    Science.gov (United States)

    Thoe, Robert S.

    1991-01-01

    Method and apparatus for producing sharp, chromatic, magnified images of X-ray emitting objects, are provided. The apparatus, which constitutes an X-ray microscope or telescope, comprises a connected collection of Bragg reflecting planes, comprised of either a bent crystal or a synthetic multilayer structure, disposed on and adjacent to a locus determined by a spherical surface. The individual Bragg planes are spatially oriented to Bragg reflect radiation from the object location toward the image location. This is accomplished by making the Bragg planes spatially coincident with the surfaces of either a nested series of prolate ellipsoids of revolution, or a nested series of spheres. The spacing between the Bragg reflecting planes can be tailored to control the wavelengths and the amount of the X-radiation that is Bragg reflected to form the X-ray image.

  7. Censoring: a new approach for detection limits in total-reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Pajek, M.; Kubala-Kukus, A.; Braziewicz, J.

    2004-01-01

    It is shown that the detection limits in the total-reflection X-ray fluorescence (TXRF), which restrict quantification of very low concentrations of trace elements in the samples, can be accounted for using the statistical concept of censoring. We demonstrate that the incomplete TXRF measurements containing the so-called 'nondetects', i.e. the non-measured concentrations falling below the detection limits and represented by the estimated detection limit values, can be viewed as the left random-censored data, which can be further analyzed using the Kaplan-Meier (KM) method correcting for nondetects. Within this approach, which uses the Kaplan-Meier product-limit estimator to obtain the cumulative distribution function corrected for the nondetects, the mean value and median of the detection limit censored concentrations can be estimated in a non-parametric way. The Monte Carlo simulations performed show that the Kaplan-Meier approach yields highly accurate estimates for the mean and median concentrations, being within a few percent with respect to the simulated, uncensored data. This means that the uncertainties of KM estimated mean value and median are limited in fact only by the number of studied samples and not by the applied correction procedure for nondetects itself. On the other hand, it is observed that, in case when the concentration of a given element is not measured in all the samples, simple approaches to estimate a mean concentration value from the data yield erroneous, systematically biased results. The discussed random-left censoring approach was applied to analyze the TXRF detection-limit-censored concentration measurements of trace elements in biomedical samples. We emphasize that the Kaplan-Meier approach allows one to estimate the mean concentrations being substantially below the mean level of detection limits. Consequently, this approach gives a new access to lower the effective detection limits for TXRF method, which is of prime interest for

  8. Polarization and spectral features of the hard x-ray continuum from non-thermal plasmas

    International Nuclear Information System (INIS)

    Hesse, M.; Platz, P.

    1989-12-01

    Starting from the cross-sections for the free-free radiation obtained within the relativistic Born-Elwert theory, we calculate the spectral and polarization properties of the hard X-ray continuum (hν > 50 KeV) for plasmas containing fast electrons with an anisotropic velocity distribution. The physical and geometrical quantities of our model are oriented towards the future lower-hybrid current drive (LHCD) experiments on Tore-Supra. Our parameter space covers parallel and perpendicular temperatures, the nuclear charge of the ions (mainly Z = 14 and 28), the cut-off energy of the electrons, the radial current profile and the viewing angle. Extensive calculations open on the optimum conditions for polarization measurements and also give guide-lines for the quantitative interpretation of data under real plasma conditions. A second part of this report will treat with the operational principles and expected performances of hard X-ray polarimeters

  9. Total reflection X-ray fluorescence applied to the chemical elements analysis of the mate tea infusion (Ilex-paraguariensis)

    International Nuclear Information System (INIS)

    Lopes, Fabio; Appoloni, Carlos R.; Cunha, Richard M. da Silva e; Nascimento Filho, Virgilio Franco do

    2002-01-01

    The purpose was to evaluate simultaneously the chemical element concentrations from K to Sr (19≤Z≤38) range in six samples of mate tea (Ilex paraguariensis) infusion, commercially available in Paraguay and South of Brazil. The chemical analysis of this beverage has a great nutritional importance for the native people of these areas, due to their large daily consumption. For the determination of these elements the dry-ashing and total reflection X-rays fluorescence (TXRF) were used. The methodology showed limits of detection among 81 ng.mL-1 for K to 10 ng.mL -1 for Zn. Six infusion samples were prepared in triplicate, and the concentration was 3,8 to 10,2 μg.mL -1 for K, Ca and Mn, 0,21 to 1,07 μg. mL -1 for Fe and Zn and 0.03 to 0,17 μg.mL -1 for Ni, Cu, Br, Rb and Sr. The Mn and Ni concentrations are above the maximum permissible values for drinking water established by World Health Organization and Brazilian legislation (these organisms do not regulate the maximum permissible values for chemical elements in mate tea infusion). (author)

  10. The optical polarization of X-ray binaries

    International Nuclear Information System (INIS)

    Dolan, J.F.

    1977-01-01

    Polarimetric observations of close binaries may reveal the presence of a black-hole secondary. The Einstein photometric effect will introduce a characteristic, time-varying signature upon the interstellar polarization. For several reasons, it is concluded that the short time-scale variability in the polarization in HDE 226868 is caused by Rayleigh scattering from gas streams known to exist in the system. X Persei may have a variable polarization consistent with the predicted effectics and (Auth)

  11. The X-ray reflectivity of the AXAF VETA-I optics

    Science.gov (United States)

    Kellogg, E.; Chartas, G.; Graessle, D.; Hughes, J. P.; Van Speybroeck, L.; Zhao, Ping; Weisskopf, M. C.; Elsner, R. F.; O'Dell, S. L.

    1993-01-01

    The study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.

  12. Energy dispersive X-ray fluorescence analysis with Bragg polarized Mo radiation. Energiedispersive Roentgenfluoreszenzanalyse mit Bragg-polarisierter Mo Strahlung

    Energy Technology Data Exchange (ETDEWEB)

    Gloeckl, H

    1983-01-01

    The aim of introducing energy dispersive analysis into X-ray fluorescence analysis is to suppress background from the Bremsstrahlung spectrum and the characteristic radiation without an undue reduction of the signal. The variant under consideration uses linearly polarization radiation obtained after a Bragg reflection,under delta = 90/sup 0/. In an introductory part, Bragg reflection, fluorescence and strong radiation are considered quantitatively with respect to counting statistics and detection limits. In the experimental part two combinations are describe, of a Ta crystal with a Cr tube and of a Mo crystal with a Mo tube. Details of adjustment, sample preparation and calibration and detection limits are given. The pros and cons of the Ta/Cr and the Mo/Mo are contrasted and proposals for further improvements are given.

  13. Effect of modulation of the particle size distributions in the direct solid analysis by total-reflection X-ray fluorescence

    Science.gov (United States)

    Fernández-Ruiz, Ramón; Friedrich K., E. Josue; Redrejo, M. J.

    2018-02-01

    The main goal of this work was to investigate, in a systematic way, the influence of the controlled modulation of the particle size distribution of a representative solid sample with respect to the more relevant analytical parameters of the Direct Solid Analysis (DSA) by Total-reflection X-Ray Fluorescence (TXRF) quantitative method. In particular, accuracy, uncertainty, linearity and detection limits were correlated with the main parameters of their size distributions for the following elements; Al, Si, P, S, K, Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, As, Se, Rb, Sr, Ba and Pb. In all cases strong correlations were finded. The main conclusion of this work can be resumed as follows; the modulation of particles shape to lower average sizes next to a minimization of the width of particle size distributions, produce a strong increment of accuracy, minimization of uncertainties and limit of detections for DSA-TXRF methodology. These achievements allow the future use of the DSA-TXRF analytical methodology for development of ISO norms and standardized protocols for the direct analysis of solids by mean of TXRF.

  14. Total reflection x-ray fluorescence spectroscopy as a tool for evaluation of iron concentration in ferrofluids and yeast samples

    Energy Technology Data Exchange (ETDEWEB)

    Kulesh, N.A., E-mail: nikita.kulesh@urfu.ru [Ural Federal University, Mira 19, 620002 Ekaterinburg (Russian Federation); Novoselova, I.P. [Ural Federal University, Mira 19, 620002 Ekaterinburg (Russian Federation); Immanuel Kant Baltic Federal University, 236041 Kaliningrad (Russian Federation); Safronov, A.P. [Ural Federal University, Mira 19, 620002 Ekaterinburg (Russian Federation); Institute of Electrophysics UD RAS, Amundsen 106, 620016 Ekaterinburg (Russian Federation); Beketov, I.V.; Samatov, O.M. [Institute of Electrophysics UD RAS, Amundsen 106, 620016 Ekaterinburg (Russian Federation); Kurlyandskaya, G.V. [Ural Federal University, Mira 19, 620002 Ekaterinburg (Russian Federation); University of the Basque Country UPV-EHU, 48940 Leioa (Spain); Morozova, M. [Ural Federal University, Mira 19, 620002 Ekaterinburg (Russian Federation); Denisova, T.P. [Irkutsk State University, Karl Marks 1, 664003 Irkutsk (Russian Federation)

    2016-10-01

    In this study, total reflection x-ray fluorescent (TXRF) spectrometry was applied for the evaluation of iron concentration in ferrofluids and biological samples containing iron oxide magnetic nanoparticles obtained by the laser target evaporation technique. Suspensions of maghemite nanoparticles of different concentrations were used to estimate the limitation of the method for the evaluation of nanoparticle concentration in the range of 1–5000 ppm in absence of organic matrix. Samples of single-cell yeasts grown in the nutrient media containing maghemite nanoparticles were used to study the nanoparticle absorption mechanism. The obtained results were analyzed in terms of applicability of TXRF for quantitative analysis in a wide range of iron oxide nanoparticle concentrations for biological samples and ferrofluids with a simple established protocol of specimen preparation. - Highlights: • Ferrofluids and yeasts samples were analysed by TXRF spectroscopy. • Simple protocol for iron quantification by means of TXRF was proposed. • Results were combined with magnetic, structural, and morphological characterization. • Preliminary conclusion on nanoparticles uptake mechanism was made.

  15. Total reflection X-ray fluorescence as a convenient tool for determination of trace elements in microscale gasoline and diesel

    Science.gov (United States)

    Zhang, Airui; Jin, Axiang; Wang, Hai; Wang, Xiaokang; Zha, Pengfei; Wang, Meiling; Song, Xiaoping; Gao, Sitian

    2018-03-01

    Quantitative determination of trace elements like S, Fe, Cu, Mn and Pb in gasoline and S in diesel is of great importance due to the growing concerns over air pollution, human health and engine failure caused by utilization of gasoline and diesel with these harmful elements. A method of total reflection X-ray fluorescence (TXRF) was developed to measure these harmful trace elements in gasoline and diesel. A variety of factors to affect measurement results, including TXRF parameters, microwave-assisted digestion conditions and internal standard element and its addition, were examined to optimize these experimental procedures. The hydrophobic treatment of the surface of quartz reflectors to support the analyte with neutral silicone solutions could prepare thin films of gasoline and diesel digestion solutions for subsequent TXRF analysis. The proposed method shows good potential and reliability to determine the content of harmful trace elements in gasoline and diesel with high sensitivity and accuracy without drawing different standard calibration curves, and can be easily employed to screen gasoline and diesel in routine quality control and assurance.

  16. Total reflection x-ray fluorescence spectroscopy as a tool for evaluation of iron concentration in ferrofluids and yeast samples

    International Nuclear Information System (INIS)

    Kulesh, N.A.; Novoselova, I.P.; Safronov, A.P.; Beketov, I.V.; Samatov, O.M.; Kurlyandskaya, G.V.; Morozova, M.; Denisova, T.P.

    2016-01-01

    In this study, total reflection x-ray fluorescent (TXRF) spectrometry was applied for the evaluation of iron concentration in ferrofluids and biological samples containing iron oxide magnetic nanoparticles obtained by the laser target evaporation technique. Suspensions of maghemite nanoparticles of different concentrations were used to estimate the limitation of the method for the evaluation of nanoparticle concentration in the range of 1–5000 ppm in absence of organic matrix. Samples of single-cell yeasts grown in the nutrient media containing maghemite nanoparticles were used to study the nanoparticle absorption mechanism. The obtained results were analyzed in terms of applicability of TXRF for quantitative analysis in a wide range of iron oxide nanoparticle concentrations for biological samples and ferrofluids with a simple established protocol of specimen preparation. - Highlights: • Ferrofluids and yeasts samples were analysed by TXRF spectroscopy. • Simple protocol for iron quantification by means of TXRF was proposed. • Results were combined with magnetic, structural, and morphological characterization. • Preliminary conclusion on nanoparticles uptake mechanism was made.

  17. CRL X-ray tube

    International Nuclear Information System (INIS)

    Kolchevsky, N.N.; Petrov, P.V.

    2015-01-01

    A novel types of X-ray tubes with refractive lenses are proposed. CRL-R X-ray tube consists of Compound Refractive Lens- CRL and Reflection X-ray tube. CRL acts as X-ray window. CRL-T X-ray consists of CRL and Transmission X-ray tube. CRL acts as target for electron beam. CRL refractive lens acts as filter, collimator, waveguide and focusing lens. Properties and construction of the CRL X-ray tube are discussed. (authors)

  18. Improvement of the crossed undulator design for effective circular polarization control in X-ray FELs

    Energy Technology Data Exchange (ETDEWEB)

    Geloni, Gianluca [European XFEL GmbH, Hamburg (Germany); Kocharyan, Vitali; Saldin, Evgeni [Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)

    2011-01-15

    The production of X-ray radiation with a high degree of circular polarization constitutes an important goal at XFEL facilities. A simple scheme to obtain circular polarization control with crossed undulators has been proposed so far. In its simplest configuration the crossed undulators consist of pair of short planar undulators in crossed position separated by an electromagnetic phase shifter. An advantage of this configuration is a fast helicity switching. A drawback is that a high degree of circular polarization (over 90 %) can only be achieved for lengths of the insertion devices significantly shorter than the gain length, i.e. at output power significantly lower than the saturation power level. The obvious and technically possible extension considered in this paper, is to use a setup with two or more crossed undulators separated by phase shifters. This cascade crossed undulator scheme is distinguished, in performance, by a fast helicity switching, a high degree of circular polarization (over 95%) and a high output power level, comparable with the saturation power level in the baseline undulator at fundamental wavelength. We present feasibility study and exemplifications for the LCLS baseline in the soft X-ray regime. (orig.)

  19. X-ray Absorption Spectroscopy

    Energy Technology Data Exchange (ETDEWEB)

    Yano, Junko; Yachandra, Vittal K.

    2009-07-09

    This review gives a brief description of the theory and application of X-ray absorption spectroscopy, both X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS), especially, pertaining to photosynthesis. The advantages and limitations of the methods are discussed. Recent advances in extended EXAFS and polarized EXAFS using oriented membranes and single crystals are explained. Developments in theory in understanding the XANES spectra are described. The application of X-ray absorption spectroscopy to the study of the Mn4Ca cluster in Photosystem II is presented.

  20. Initial idea to use optical flats for x-ray fluorescence analysis and recent applications to diffraction studies

    International Nuclear Information System (INIS)

    Horiuchi, T.

    1993-01-01

    Described in this work is the initial idea of using an optical flat for X-ray fluorescence analysis based upon studies of anomalous surface reflection (ASR). To develop total-reflection X-ray fluorescence analysis (TXRF) as one of the most powerful tools for microchemical analysis, various experiments such as the micro-determinations of uranium in sea-water, iron in human blood and rare earth elements in hot spring-water were attempted. Furthermore, the physically interesting experiment on Compton scattering under total-reflection conditions was conducted. Recent applications of the total-reflection phenomenon to diffraction studies, i.e. total-reflection X-ray diffraction (TXRD), are also presented. (author)

  1. Thermal disc emission from a rotating black hole: X-ray polarization signatures

    Czech Academy of Sciences Publication Activity Database

    Dovčiak, Michal; Muleri, F.; Goosmann, René; Karas, Vladimír; Matt, G.

    2008-01-01

    Roč. 391, č. 1 (2008), s. 32-38 ISSN 0035-8711 R&D Projects: GA ČR GA205/07/0052; GA MŠk(CZ) LC06014 Grant - others:ESA(XE) ESA-PECS project No. 98040 Institutional research plan: CEZ:AV0Z10030501 Keywords : polarization * relativity * instrumentation: polarimeters * X-rays: binaries Subject RIV: BN - Astronomy, Celestial Mechanics, Astrophysics Impact factor: 5.185, year: 2008

  2. REX - a program for the analysis of X-ray reflectivity data: user guide and programmer manual

    International Nuclear Information System (INIS)

    Crabb, T.A.; Gibson, P.N.

    1992-12-01

    A FORTRAN program REX, which has been developed to facilitate the interpretation of X-ray reflectivity data, is described. The program allows the simulation of reflectivity profiles as a function of either incident angle or of energy. Factors such as anomalous dispersion, and surface and interface roughness are taken into account in the model. In addition, experimental data of reflectivity as a function of incident angle can be matched to user-supplied theoretical parameters by a least-squares refinement procedure. Experimental reflectivity data recorded at several X-ray wavelengths can be analysed simultaneously, thus eliminating certain experimental errors. (author)

  3. X-ray reflectivity study of thermal capillary waves on liquid surfaces

    International Nuclear Information System (INIS)

    Ocko, B.M.; Wu, X.Z.; Sirota, E.B.; Sinha, S.K.; Deutsch, M.

    1994-01-01

    X-ray reflectivity measurements have been carried out at the liquid/vapor interface of normal alkanes. The reflectivities over a large temperature range of different chain lengths (C20 and C36) provide a critical test of the various capillary wave models. Our data are most consistent with the hybrid model which allows for a molecular size dependent cutoff q max for the capillary waves and an intrinsic interface width σ 0

  4. Design and Tests of the Hard X-ray Polarimeter X-Calibur

    Directory of Open Access Journals (Sweden)

    M. Beilicke

    2014-12-01

    Full Text Available X-ray polarimetry promises to give qualitatively new information bout high-energy astrophysical sources, such as binary black hole  systems, micro-quasars, active galactic nuclei, and gamma-ray bursts. We designed, built and tested ahard X-ray polarimeter, X-Calibur, to be used in the focal plane of the InFOCuS grazing incidence hard X-ray telescope.X-Calibur combines a low-Z Compton scatterer with a CZT detector assembly to measure the polarization of 20−60 keV X-rays making use of the fact that polarized photons Compton scatter preferentially perpendicular to the electric field orientation; in principal, a similar space-borne experiment could be operated in the 5−100 keV regime. X-Calibur achieves a high detection efficiency of order unity.

  5. Rocket Experiment Demonstration of a Soft X-ray Polarimeter

    Science.gov (United States)

    Marshall, Herman

    This proposal is the lead proposal. Boston University will submit, via NSPIRES, a Co-I proposal, per instructions for Suborbital proposals for multiple-award. Our scientific goal of the Rocket Experiment Demonstration of a Soft X-ray Polarimeter (REDSoX Polarimeter) is to make the first measurement of the linear X-ray polarization of an extragalactic source in the 0.2-0.8 keV band. The first flight of the REDSoX Polarimeter would target Mk 421, which is commonly modeled as a highly relativistic jet aimed nearly along the line of sight. Such sources are likely to be polarized at a level of 30-60%, so the goal is to obtain a significant detection even if it is as low as 10%. Significant revisions to the models of jets emanating from black holes at the cores of active galaxies would be required if the polarization fraction lower than 10%. We employ multilayer-coated mirrors as Bragg reflectors at the Brewster angle. By matching to the dispersion of a spectrometer, one may take advantage of high multilayer reflectivities and achieve polarization modulation factors over 90%. Using replicated foil mirrors from MSFC and gratings made at MIT, we construct a spectrometer that disperses to three laterally graded multilayer mirrors (LGMLs). The lateral grading changes the wavelength of the Bragg peak for 45 degree reflections linearly across the mirror, matching the dispersion of the spectrometer. By dividing the entrance aperture into six equal sectors, pairs of blazed gratings from opposite sectors are oriented to disperse to the same LGML. The position angles for the LGMLs are 120 degrees to each other. CCD detectors then measure the intensities of the dispersed spectra after reflection and polarizing by the LGMLs, giving the three Stokes parameters needed to determine the source polarization. We will rely on components whose performance has been verified in the laboratory or in space. The CCD detectors are based on Chandra and Suzaku heritage. The mirror fabrication team

  6. Vapor phase treatment–total reflection X-ray fluorescence for trace elemental analysis of silicon wafer surface

    International Nuclear Information System (INIS)

    Takahara, Hikari; Mori, Yoshihiro; Shibata, Harumi; Shimazaki, Ayako; Shabani, Mohammad B.; Yamagami, Motoyuki; Yabumoto, Norikuni; Nishihagi, Kazuo; Gohshi, Yohichi

    2013-01-01

    Vapor phase treatment (VPT) was under investigation by the International Organization for Standardization/Technical Committee 201/Working Group 2 (ISO/TC201/WG2) to improve the detection limit of total reflection X-ray fluorescence spectroscopy (TXRF) for trace metal analysis of silicon wafers. Round robin test results have confirmed that TXRF intensity increased by VPT for intentional contamination with 5 × 10 9 and 5 × 10 10 atoms/cm 2 Fe and Ni. The magnification of intensity enhancement varied greatly (1.2–4.7 in VPT factor) among the participating laboratories, though reproducible results could be obtained for average of mapping measurement. SEM observation results showed that various features, sizes, and surface densities of particles formed on the wafer after VPT. The particle morphology seems to have some impact on the VPT efficiency. High resolution SEM observation revealed that a certain number of dots with SiO 2 , silicate and/or carbon gathered to form a particle and heavy metals, Ni and Fe in this study were segregated on it. The amount and shape of the residue should be important to control VPT factor. - Highlights: • This paper presents a summary of study results of VPT–TXRF using ISO/TC201/WG2. • Our goal is to analyze the trace metallic contamination on silicon wafer with concentrations below 1 × 10 10 atoms/cm 2 . • The efficiency and mechanism of VPT are discussed under several round robin tests and systematic studies

  7. Method for spatially modulating X-ray pulses using MEMS-based X-ray optics

    Science.gov (United States)

    Lopez, Daniel; Shenoy, Gopal; Wang, Jin; Walko, Donald A.; Jung, Il-Woong; Mukhopadhyay, Deepkishore

    2015-03-10

    A method and apparatus are provided for spatially modulating X-rays or X-ray pulses using microelectromechanical systems (MEMS) based X-ray optics. A torsionally-oscillating MEMS micromirror and a method of leveraging the grazing-angle reflection property are provided to modulate X-ray pulses with a high-degree of controllability.

  8. X-ray reflection from cold matter in the nuclei of active galaxies

    International Nuclear Information System (INIS)

    Pounds, K.A.; Nandra, K.; Stewart, G.C.; George, I.M.; Fabian, A.C.

    1990-01-01

    The evidence accumulated over the past few years for strong soft X-ray emission from active galactic nuclei has been interpreted as black body emission from the innermost stable region of an accretion disk feeding the putative black hole at the centre of the active nucleus, a view given strong support by the rapid variability of some soft X-ray components. More recently, new X-ray data from the Exosat and Ginga satellites have revealed a second indicator of optically thick matter in the vicinity of the active nucleus, in the form of an iron K-fluorescence line at ≅ 6.4 keV. We report the discovery of two further common features of continuum absorption and reflection, revealed in a composite spectrum from twelve Ginga observations of Seyfert-type active galactic nuclei. Most of these spectral features are shown to be well modelled by reprocessing of the hard X-ray power-law continuum in a slab (or perhaps a disk) of cold matter. There is also evidence for a substantial line-of-sight column of photoionized material. (author)

  9. Performance of the PRAXyS X-ray polarimeter

    Energy Technology Data Exchange (ETDEWEB)

    Iwakiri, W.B., E-mail: wataru.iwakiri@riken.jp [RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan); Black, J.K. [NASA Goddard Space Flight Center, Greenbelt, MD 20771 (United States); Rock Creek Scientific, 1400 East-West Hwy, Silver Spring, MD 20910 (United States); Cole, R. [NASA Goddard Space Flight Center, Greenbelt, MD 20771 (United States); Enoto, T. [The Hakubi Center for Advanced Research, Kyoto University, Kyoto 606-8302 (Japan); Department of Astronomy, Kyoto University, Kitashirakawa-Oiwake-cho, Sakyo-ku, Kyoto 606-8502 (Japan); Hayato, A. [RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan); Hill, J.E.; Jahoda, K. [NASA Goddard Space Flight Center, Greenbelt, MD 20771 (United States); Kaaret, P. [University of Iowa, Iowa City, IA 52242 (United States); Kitaguchi, T. [Department of Physical Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526 (Japan); Kubota, M. [Department of Physics, Tokyo University of Science, 3-1 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan. (Japan); RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan); Marlowe, H.; McCurdy, R. [University of Iowa, Iowa City, IA 52242 (United States); Takeuchi, Y. [Department of Physics, Tokyo University of Science, 3-1 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan. (Japan); RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan); Tamagawa, T. [RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198 (Japan); Department of Physics, Tokyo University of Science, 3-1 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan. (Japan)

    2016-12-01

    The performance of the Time Projection Chamber (TPC) polarimeter for the Polarimeter for Relativistic Astrophysical X-ray Sources (PRAXyS) Small Explorer was evaluated using polarized and unpolarized X-ray sources. The PRAXyS mission will enable exploration of the universe through X-ray polarimetry in the 2–10 keV energy band. We carried out performance tests of the polarimeter at the Brookhaven National Laboratory, National Synchrotron Light Source (BNL-NSLS) and at NASA's Goddard Space Flight Center. The polarimeter was tested with linearly polarized, monochromatic X-rays at 11 different energies between 2.5 and 8.0 keV. At maximum sensitivity, the measured modulation factors at 2.7, 4.5 and 8.0 keV are 27%, 43% and 59%, respectively and the measured angle of polarization is consistent with the expected value at all energies. Measurements with a broadband, unpolarized X-ray source placed a limit of less than 1% on false polarization in the PRAXyS polarimeter.

  10. Performance of the PRAXyS X-ray polarimeter

    Science.gov (United States)

    Iwakiri, W. B.; Black, J. K.; Cole, R.; Enoto, T.; Hayato, A.; Hill, J. E.; Jahoda, K.; Kaaret, P.; Kitaguchi, T.; Kubota, M.; Marlowe, H.; McCurdy, R.; Takeuchi, Y.; Tamagawa, T.

    2016-12-01

    The performance of the Time Projection Chamber (TPC) polarimeter for the Polarimeter for Relativistic Astrophysical X-ray Sources (PRAXyS) Small Explorer was evaluated using polarized and unpolarized X-ray sources. The PRAXyS mission will enable exploration of the universe through X-ray polarimetry in the 2-10 keV energy band. We carried out performance tests of the polarimeter at the Brookhaven National Laboratory, National Synchrotron Light Source (BNL-NSLS) and at NASA's Goddard Space Flight Center. The polarimeter was tested with linearly polarized, monochromatic X-rays at 11 different energies between 2.5 and 8.0 keV. At maximum sensitivity, the measured modulation factors at 2.7, 4.5 and 8.0 keV are 27%, 43% and 59%, respectively and the measured angle of polarization is consistent with the expected value at all energies. Measurements with a broadband, unpolarized X-ray source placed a limit of less than 1% on false polarization in the PRAXyS polarimeter.

  11. The Imaging X-ray Polarimetry Explorer (IXPE

    Directory of Open Access Journals (Sweden)

    Martin C. Weisskopf

    Full Text Available The Imaging X-ray Polarimetry Explorer (IXPE expands observation space by simultaneously adding polarization to the array of X-ray source properties currently measured (energy, time, and location. IXPE will thus open new dimensions for understanding how X-ray emission is produced in astrophysical objects, especially in systems under extreme physical conditions. Keywords: X-ray astronomy, X-ray polarimetry, X-ray imaging

  12. Efficient isotope ratio analysis of uranium particles in swipe samples by total-reflection x-ray fluorescence spectrometry and secondary ion mass spectrometry

    International Nuclear Information System (INIS)

    Esaka, Fumitaka; Watanabe, Kazuo; Fukuyama, Hiroyasu; Onodera, Takashi; Esaka, Konomi T.; Magara, Masaaki; Sakurai, Satoshi; Usuda, Shigekazu

    2004-01-01

    A new particle recovery method and a sensitive screening method were developed for subsequent isotope ratio analysis of uranium particles in safeguards swipe samples. The particles in the swipe sample were recovered onto a carrier by means of vacuum suction-impact collection method. When grease coating was applied to the carrier, the recovery efficiency was improved to 48±9%, which is superior to that of conventionally-used ultrasoneration method. Prior to isotope ratio analysis with secondary ion mass spectrometry (SIMS), total reflection X-ray fluorescence spectrometry (TXRF) was applied to screen the sample for the presence of uranium particles. By the use of Si carriers in TXRF analysis, the detection limit of 22 pg was achieved for uranium. By combining these methods with SIMS, the isotope ratios of 235 U/ 238 U for individual uranium particles were efficiently determined. (author)

  13. Asymptotic form of the reciprocity theorem with applications in x-ray scattering

    International Nuclear Information System (INIS)

    Caticha, Ariel

    2000-01-01

    The emission of electromagnetic waves from a source within or near a nontrivial medium (with or without boundaries, crystalline or amorphous, with inhomogeneities, absorption, and so on) is sometimes studied using the reciprocity principle which is a variation of the method of Green's functions. If one is only interested in the asymptotic radiation fields the generality of these methods may actually be a shortcoming: obtaining expressions valid for the uninteresting near fields is not just a wasted effort but may be prohibitively difficult. In this work we obtain a modified form of the reciprocity principle which gives the asymptotic radiation field directly. The method may also be used to study scattering problems. We give a few pedagogical examples and then, as more challenging applications, we calculate the specular reflection of x rays by a rough surface and by a smoothly graded surface taking polarization effects into account. In conventional treatments of reflection, x rays are treated as scalar waves; polarization effects are neglected. This is a good approximation at grazing incidence but becomes increasingly questionable for soft x rays and UV at higher incidence angles

  14. XIPE, the X-ray imaging polarimetry explorer: Opening a new window in the X-ray sky

    Science.gov (United States)

    Soffitta, Paolo; XIPE Collaboration

    2017-11-01

    XIPE, the X-ray Imaging Polarimetry Explorer, is a candidate ESA fourth medium size mission, now in competitive phase A, aimed at time-spectrally-spatially-resolved X-ray polarimetry of a large number of celestial sources as a breakthrough in high energy astrophysics and fundamental physics. Its payload consists of three X-ray optics with a total effective area larger than one XMM mirror but with a low mass and of three Gas Pixel Detectors at their focus. The focal length is 4 m and the whole satellite fits within the fairing of the Vega launcher without the need of an extendable bench. XIPE will be an observatory with 75% of the time devoted to a competitive guest observer program. Its consortium across Europe comprises Italy, Germany, Spain, United Kingdom, Switzerland, Poland, Sweden Until today, thanks to a dedicated experiment that dates back to the '70, only the Crab Nebula showed a non-zero polarization with large significance [1] in X-rays. XIPE, with its innovative detector, promises to make significative measurements on hundreds of celestial sources.

  15. Soft-x-ray magneto-optical Kerr effect and element-specific hysteresis measurement

    Energy Technology Data Exchange (ETDEWEB)

    Kortright, J.B.; Rice, M. [Lawrence Berkeley National Lab., CA (United States)

    1997-04-01

    Interest in the utilization of x-ray magneto-optical properties to provide element-specific magnetic information, combined with recent development of tunable linear polarizers for spectroscopic polarization measurement, have led the authors to the study of magneto-optical rotation (MOR) near core levels of magnetic atoms in magnetic multilayer and alloy films. Their initial observation of Faraday rotation (in transmission) demonstrated that for Fe MOR is easily measured and is larger at its L{sub 3} resonance than in the near-visible spectral regions. This work also demonstrated that the spectroscopic behavior of the MOR signal in transmission, resulting from the differential reaction of left- and right-circular components of a linearly polarized beam, is related to the magnetic circular dichroism (MCD), or differential absorption, as expected by a Kramers-Kronig transformation. Thus MCD measurements using circular polarization and MOR measurements using linear polarization can provide complementary, and in some cases equivalent, information. On beamline 6.3.2 the authors have begun to investigate soft x-ray MOR in the reflection geometry, the x-ray magneto-optic Kerr effect (XMOKE). Early measurements have demonstrated the ability to measure element-specific hysteresis loops and large rotations compared to analogous near-visible measurements. The authors are investigating the spectral dependence of the XMOKE signal, and have initiated systematic materials studies of sputter-deposited films of Fe, Fe{sub x}Cr{sub 1{minus}x} alloys, and Fe/Cr multilayers.

  16. The Growth of Interest in Astronomical X-Ray Polarimetry

    Directory of Open Access Journals (Sweden)

    Frédéric Marin

    2018-03-01

    Full Text Available Astronomical X-ray polarimetry was first explored in the end of the 1960s by pioneering rocket instruments. The craze arising from the first discoveries of stellar and supernova remnant X-ray polarization led to the addition of X-ray polarimeters to early satellites. Unfortunately, the inadequacy of the diffraction and scattering technologies required to measure polarization with respect to the constraints driven by X-ray mirrors and detectors, coupled with long integration times, slowed down the field for almost 40 years. Thanks to the development of new, highly sensitive, compact X-ray polarimeters in the beginning of the 2000s, observing astronomical X-ray polarization has become feasible, and scientists are now ready to explore our high-energy sky thanks to modern X-ray polarimeters. In the forthcoming years, several X-ray missions (rockets, balloons, and satellites will create new observational opportunities. Interest in astronomical X-ray polarimetry field has thus been renewed, and this paper presents for the first time a quantitative assessment, all based on scientific literature, of the growth of this interest.

  17. Magneto x-ray study of a gadolinium-iron amorphous alloy

    International Nuclear Information System (INIS)

    Keller, E.N.

    1985-01-01

    This work reports the measurement of the magnetic x-ray absorption of an amorphous Gd-Fe ferrimagnetic thin film. The Gd to Fe concentration in the sample was 1:4. The magnetic x-ray effect is the x-ray analog of magneto-optic absorption effects. Magneto x-ray effects arise when a solid has different indices of refraction for right and left circularly polarized x-rays. The difference in absorption of left and right circularly polarized x-rays is called the magneto x-ray absorption. This absorption is proportional to the net spin of the final state density of states. At the L3 edge, the main x-ray transition is from initial Gd(2p) core states to final Gd(5d) unoccupied states. Since the 5d states have a net spin polarization in ferromagnetic Gd, this experiment hoped to directly observe how that polarization changes for Gd in the alloy. The magneto x-ray absorption at the Gd L3 edge will be proportional to the sign and amount of the net spin polarization of the 5d electrons. The magnetic x-ray absorption coefficient was found to be at least 0.0005 smaller than the linear absorption coefficient at the Gd white line energy. This was measured for the amorphous alloy at room temperature. Lock-in techniques were used to obtain the small limit to the absorption. A simple model for the size of the magnetic x-ray absorption coefficient in Gd suggests that the Gd(5d) net spin polarization is less than 0.01 Bohr magnetons per atom

  18. Non-Deforming, High-Reflectance X-ray Coatings for Lynx and Other Future Missions

    Science.gov (United States)

    Windt, David

    The overarching challenge addressed by this proposal is the development of highreflectance, high-resolution X-ray mirrors, to be used for the construction of lightweight X-ray telescopes for future NASA astronomy missions such as Lynx and others. The proposal's two specific aims are: 1) the development of optimized iridium-based interference coatings for the 0.1–10 keV band; and 2) the development of methods to mitigate coating-stress-induced substrate deformations in thin-shell glass and Si mirror segments. These goals will be achieved by building on established film deposition techniques and metrology infrastructure for X-ray optics that have been developed and advanced by the PI through APRA funding since 1999. Specific Aim #1: Interference Coatings for the 0.1–10 keV Energy Band Telescope effective area can be maximized by using Ir-based reflective coatings that exploit optical interference to provide higher reflectance than Ir alone. However, only preliminary investigations of such coatings have been conducted thus far; more research is required to fully optimize these coatings for maximum performance, to experimentally determine the coating designs that are feasible, and to determine the achievable X-ray reflectance, film stress, surface roughness, and thermal and temporal stability. The first specific aim of this proposal is to reach these very goals through a comprehensive research program. Demonstration of the achievable reflectance, stress, and roughness in stable, optimized coatings will in turn facilitate global telescope design optimization, by identifying the best coating for each mirror shell based on incidence angle, and on telescope effective-area and field-of-view requirements. The research has the potential to greatly increase the effective area of future X-ray telescopes. Specific Aim #2: Mitigation of Coating-Stress-Induced Substrate Deformations High-quality films of Ir and other candidate materials (e.g., B4C) to be investigated for the 0

  19. Higher order structure analysis of nano-materials by spectral reflectance of laser-plasma soft x-ray

    International Nuclear Information System (INIS)

    Azuma, Hirozumi; Takeichi, Akihiro; Noda, Shoji

    1995-01-01

    We have proposed a new experimental arrangement to measure spectral reflectance of nano-materials for analyzing higher order structure with laser-plasma soft x-rays. Structure modification of annealed Mo/Si multilayers and a nylon-6/clay hybrid with poor periodicity was investigated. The measurement of the spectral reflectance of soft x-rays from laser-produced plasma was found to be a useful method for the structure analysis of nano-materials, especially those of rather poor periodicity

  20. Seasonal determination of trace and ultra-trace content in Macrocystis pyrifera from San Jorge Gulf (Patagonia) by Total Reflection X-ray Fluorescence

    Science.gov (United States)

    Salomone, Vanesa N.; Riera, Marina; Cerchietti, Luciana; Custo, Graciela; Muniain, Claudia

    2017-05-01

    Seaweed have a great capacity to accumulate heavy metals in their tissues. The chemical characterization of seaweed is important due to their use in environmental monitoring and human or animal food. The aim of the present study was to evaluate the multi-elemental composition of seaweed from San Jorge Gulf (Patagonia, Argentina) by Total Reflection X-ray Fluorescence (TXRF). The elements As, Br, Cu, Cr, Fe, Mn, Ni, Pb, Rb, Sr, V and Zn were seasonally analyzed and quantified in blades of Macrocystis pyrifera. TXRF showed to be a suitable technique for simultaneous multi-element analysis in this kind of samples. The results revealed seasonal variations in the chemical content for some elements; arsenic content was maximum in summer and autumn, iron concentration increased to the winter and zinc concentration was maximum in autumn. The sum of principal micronutrients (Fe + Zn + Mn + Cu) varied between 114 and 171 mg k- 1 g dw. The total As concentration ranged between 36 and 66 mg kg- 1. Lead, nickel and copper were not detected.

  1. Application of the total reflection X-ray fluorescence method to the elemental analysis of brain tumors of different types and grades of malignancy

    International Nuclear Information System (INIS)

    Lankosz, M.W.; Grzelak, M.; Ostachowicz, B.; Wandzilak, A.; Szczerbowska-Boruchowska, M.; Wrobel, P.; Radwanska, E.; Adamek, D.

    2014-01-01

    The process of carcinogenesis may influence normal biochemical reactions leading to alterations in the elemental composition of the tissue. Total reflection X-ray fluorescence analysis (TXRF) was applied to the elemental analysis of different brain tumors. The following elements were present in all the neoplastic tissues analyzed: K, Ca, Fe, Cu, Zn and Rb. The results of the analysis showed that the elemental composition of a relatively small fragment of tissue represents satisfactorily the biochemical “signature” of a cancer. On the basis of the element concentrations determined, it was possible to differentiate between some types of brain tumors. - Highlights: • Elemental composition represents the biochemical signature of brain cancer. • The element levels differentiate some types of brain tumors. • TXRF spectrometry is a useful tool for elemental trace analysis of brain cancer

  2. Elemental concentration analysis in the brain of young and old Wistar rats by total reflection X-ray fluorescence spectrometry

    International Nuclear Information System (INIS)

    Serpa, Renata F.B.; Jesus, Edgar F.O. de; Lopes, Ricardo T.; Anjos, Marcelino J. dos; Carmo, Maria G.T. do; Rocha, Monica S.; Moreira, Silvana; Martinez, Ana M.B.

    2007-01-01

    It is well known that aging is associated with neurobehavioral deficits. The aging process of human brain is characterized by progressive neuronal loss. Furthermore, certain brain areas are more vulnerable to neuronal degeneration than others, reflecting an altered resistance to stress of the tissue itself and/or the lack of adequate immunological defense mechanisms in these regions. About the elemental levels in the brain, it is known that the excess ou deficiency of some elements are toxic for human healthy, being also related to several neurodegenerative diseases. In this way, the main goal of this work was to determine the elemental concentration in the hippocampus of young and old male (n = 10) and female (n = 10) Wistar rats by total reflection X-ray fluorescence spectrometry with synchrotron radiation (SR-TXRF). These measurements were carried out at XRF beam line at Light Synchrotron Brazilian Laboratory, Campinas, Brazil. About the results, we could observe that Al, Fe, Cu, Zn and Br levels were higher in the hippocampus of the old female rats than the young ones. On the other hand, only Cu levels were higher in the hippocampus of the old male rats than the young ones. Therefore, the aging of the hippocampus of the female rats can be characterized by an accumulate for Al, Fe, Cu, Zn and Br. The excess in these elements levels are also associated with several neurodegenerative disorders, such as Alzheimer' disease, Parkinson's disease and Huntington's disease. (author)

  3. Characterization by Total Reflection X-ray Fluorescence Spectrometry of filtered water into the cave under the Sun Pyramid in Teotihuacan City

    International Nuclear Information System (INIS)

    Martinez, T.; Zarazua, G.; Avila-Perez, P.; Juarez, F.; Cabrera, L.; Martinez, G.

    2008-01-01

    Teotihuacan (50 km north-east Mexico City) was the most important ancient city in Mesoamerica and it flourished 200-750 AC. It is situated in the central part of the Valley of Teotihuacan, in Central Mexico. This study was carried out in the 102 m-long cave under the largest single construction, the massive Sun Pyramid, being located on the east side of the 'Avenue of the Dead', in the northern half-part of the city. The study shows the results of Total Reflection X-ray Fluorescence Spectrometry analysis and other techniques of a water sample obtained from the inside of the cave. The inside temperature ranged between 19 and 22 deg. C; relative humidity was between 98 and 99.3%; water-dropping velocity (water de-sorption capability) was 13.5 μL min -1 . Water samples from wells around the site were analyzed too. Metal concentration in all of the water samples matches the characteristics of the sampling site, well's depth, soil and minerals

  4. Polarized high-brilliance and high-resolution soft x-ray source at ELETTRA: The performance of beamline BACH

    International Nuclear Information System (INIS)

    Zangrando, M.; Zacchigna, M.; Finazzi, M.; Cocco, D.; Rochow, R.; Parmigiani, F.

    2004-01-01

    BACH, a soft x-ray beamline for polarization-dependent experiments at the Italian synchrotron radiation facility ELETTRA, was recently completed and characterized. Its performance, in terms of energy resolution, flux and polarization, is presented. Based on two APPLE II undulators, BACH covers the energy range between 35 and 1600 eV with the control of the light polarization. The monochromator is equipped with four gratings and allows one to work either in a high resolution or in a high flux mode. After the monochromator, the beamline is split into two branches with different refocusing properties. One is optimized to exploit the performance of the soft x-ray spectrometer (ComIXS) available at the beamline. Resolving powers between 12000 at 90 eV photon energy and 6600 near 867 eV were achieved using the high-resolution gratings and the smallest available slit width (10 μm). For the high-brilliance grating, which works between 290 and 1600 eV, resolving powers between 7000 at 400 eV and 2200 at 867 eV were obtained. The flux in the experimental chamber, measured with the high-resolution gratings for linearly polarized light at the best achievable resolution, ranges between 4x10 11 photons/s at 125 eV and 2x10 10 photons/s between 900 and 1250 eV. In circularly polarized mode the flux is two times larger for energies up to 380 eV. A gain of nearly one order of magnitude is obtained for the high-brilliance grating, in accordance with theoretical predictions. Flux beyond 1.3x10 11 photons/s was measured up to 1300 eV, and thus over nearly the complete energy range covered by this high-brilliance grating, with a maximum of 1.6x10 11 photons/s between 800 and 1100 eV. First results from polarization measurements confirm a polarization above 99.7% for both linearly and circularly polarized modes at low energies. Circular dichroism experiments indicate a circular polarization beyond 90% at the Fe L 2 /L 3 edge near 720 eV

  5. Detection and quantitative determination of heavy metals in electronic cigarette refill liquids using Total Reflection X-ray Fluorescence Spectrometry.

    Science.gov (United States)

    Kamilari, Eleni; Farsalinos, Konstantinos; Poulas, Konstantinos; Kontoyannis, Christos G; Orkoula, Malvina G

    2018-06-01

    Electronic cigarettes are considered healthier alternatives to conventional cigarettes containing tobacco. They produce vapor through heating of the refill liquids (e-liquids) which consist of propylene glycol, vegetable glycerin, nicotine (in various concentrations), water and flavoring agents. Heavy metals may enter the refill liquid during the production, posing a risk for consumer's health due to their toxicity. The objective of the present study was the development of a methodology for the detection and quantitative analysis of cadmium (Cd), lead (Pb), nickel (Ni), copper (Cu), arsenic (As) and chromium (Cr), employing Total Reflection X-Ray Fluorescence Spectroscopy (TXRF) as an alternative technique to ICP-MS or ICP-OES commonly used for this type of analysis. TXRF was chosen due to its advantages, which include short analysis time, promptness, simultaneous multi-element analysis capability and minimum sample preparation, low purchase and operational cost. The proposed methodology was applied to a large number of electronic cigarette liquids commercially available, as well as their constituents, in order to evaluate their safety. TXRF may be a valuable tool for probing heavy metals in electronic cigarette refill liquids to serve for the protection of human health. Copyright © 2018 Elsevier Ltd. All rights reserved.

  6. Sum rules application to reflectometry of X-ray resonant radiation for magnetic multilayer investigation

    International Nuclear Information System (INIS)

    Smekhova, A.G.; Andreeva, M.A.

    2005-01-01

    One elaborated the general formalism on the basis of which one derived the clear expressions for reflection factors of X-ray radiation with a circular polarization from medium magnetized both within surface plane and within reflection plane both for grazing angles and for high grazing angles. The asymmetry of reflection spectra for right- and left-polarized radiation is shown to depend both on nondiagonal components of a susceptibility tensor and on other components in contrast to absorption spectra, so the sum rule to determine the orbital and the spin magnetic moments can not be applied directly to the experimental spectra of reflection [ru

  7. Synchrotron x-ray fluorescence and extended x-ray absorption fine structure analysis

    International Nuclear Information System (INIS)

    Chen, J.R.; Gordon, B.M.; Hanson, A.L.; Jones, K.W.; Kraner, H.W.; Chao, E.C.T.; Minkin, J.A.

    1984-01-01

    The advent of dedicated synchrotron radiation sources has led to a significant increase in activity in many areas of science dealing with the interaction of x-rays with matter. Synchrotron radiation provides intense, linearly polarized, naturally collimated, continuously tunable photon beams, which are used to determine not only the elemental composition of a complex, polyatomic, dilute material but also the chemical form of the elements with improved accuracy. Examples of the application of synchrotron radiation include experiments in synchrotron x-ray fluorescence (SXRF) analysis and extended x-ray absorption fine structure (EXAFS) analysis. New synchrotron radiation x-ray microprobes for elemental analysis in the parts per billion range are under construction at several laboratories. 76 references, 24 figures

  8. Determination of As concentration in earthworm coelomic fluid extracts by total-reflection X-ray fluorescence spectrometry

    Science.gov (United States)

    Allegretta, Ignazio; Porfido, Carlo; Panzarino, Onofrio; Fontanella, Maria Chiara; Beone, Gian Maria; Spagnuolo, Matteo; Terzano, Roberto

    2017-04-01

    Earthworms are often used as sentinel organisms to study As bioavailability in polluted soils. Arsenic in earthworms is mainly sequestrated in the coelomic fluids whose As content can therefore be used to asses As bioavalability. In this work, a method for determining As concentration in coelomic fluid extracts using total-reflection X-ray fluorescence spectrometry (TXRF) is presented. For this purpose coelomic fluid extracts from earthworms living in three polluted soils and one non-polluted (control) soil have been collected and analysed. A very simple sample preparation was implemented, consisting of a dilution of the extracts with polyvinyl alcohol (PVA) using a 1:8 ratio and dropwise deposition of the sample on the reflector. A detection limit of 0.2 μg/l and quantification limit of 0.6 μg/l was obtained in the diluted samples, corresponding to 2 μg/l and 6 μg/l in the coelomic fluid extracts, respectively. This allowed to quantify As concentration in coelomic fluids extracted from earthworms living in soils polluted with As at concentrations higher than 20 mg/kg (considered as a pollution threshold for agricultural soils). The TXRF method has been validated by comparison with As concentrations in standards and by analysing the same samples by ICP-MS, after acid digestion of the sample. The low limit of detection, the proven reliability of the method and the little sample preparation make TXRF a suitable, cost-efficient and "green" technique for the analysis of As in earthworm coelomic fluid extracts for bioavailability studies.

  9. Polarized-x-ray-absorption studies of graphite intercalated-bromine compounds

    International Nuclear Information System (INIS)

    Feldman, J.L.; Elam, W.T.; Ehrlich, A.C.; Skelton, E.F.; Dominguez, D.D.; Chung, D.D.L.; Lytle, F.W.

    1986-01-01

    Details of both results and data analysis are given in the case of our polarized-x-ray-absorption experiments, using synchrotron radiation, on highly oriented pyrolytic graphite (HOPG)--based and graphite-fiber-based residual-bromine intercalation compounds. The effective angle which nearest-neighbor Br pairs make with crystallite graphite planes in some of these compounds, which was stated to be approx.20 0 in an earlier article, is shown to be 16X(de +- 4X(de: both Br-Br extended x-ray-absorption fine structure (EXAFS) and white-line features of the data are the basis of this result. We have also found that, whereas spherical averages of the areas under white-line spectra are independent of the choice of the material among all samples studied (including Br 2 vapor), differences in similarly spherically averaged Br-Br EXAFS amplitudes are evident, especially between Br 2 vapor and Br-graphite samples. We show that the latter differences which correspond to a coordination number less than one in Br-graphite are not due to either Gaussian or non-Gaussian (up to k 4 terms) Debye-Waller effects. In addition, we discuss the extraction of Br-C EXAFS and present results of model calculations of Br-C EXAFS, where several different structural models for the Br sites are considered. We also discuss thermal effects and their relation to known Br sublattice phase-transition behavior, based on our measurements at room temperature, 360 K, and 400 K

  10. X-ray scattering measurements from thin-foil x-ray mirrors

    DEFF Research Database (Denmark)

    Christensen, Finn Erland; BYRNAK, BP; Hornstrup, Allan

    1992-01-01

    Thin foil X-ray mirrors are to be used as the reflecting elements in the telescopes of the X-ray satellites Spectrum-X-Gamma (SRG) and ASTRO-D. High resolution X-ray scattering measurements from the Au coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned...... in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The X-ray data is compared with laser data and other surface structure data such as STM, atomic force microscopy (AFM), TEM, and electron micrography. The data obtained at Cu K-alpha(1), (8.05 keV) from all...

  11. X-Ray Polarimetry with GEMS

    Science.gov (United States)

    Strohmayer, Tod

    2011-01-01

    The polarization properties of cosmic X-ray sources are still largely unexplored. The Gravity and Extreme Magnetism SMEX (GEMS) will carry out the first sensitive X-ray polarization survey of a wide range of sources including; accreting compact objects (black holes and neutron stars), AGN, supernova remnants, magnetars and rotation-powered pulsars. GEMS employs grazing-incidence foil mirrors and novel time-projection chamber (TPC) polarimeters leveraging the photoelectric effect to achieve high polarization sensitivity in the 2 - 10 keV band. I will provide an update of the project status, illustrate the expected performance with several science examples, and provide a brief overview of the data analysis challenges

  12. X-ray diffraction study of lithium hydrazinium sulfate and lithium ammonium sulfate crystals under a static electric field

    International Nuclear Information System (INIS)

    Sebastian, M.T.; Becker, R.A.; Klapper, H.

    1991-01-01

    X-ray diffraction studies are made on proton-conducting polar lithium hydrazinium sulfate and ferroelectric lithium ammonium sulfate. The X-ray rocking curves recorded with in situ electric field along the polar b axis of lithium hydrazinium sulfate (direction of proton conductivity) show a strong enhancement of the 0k0 diffraction intensity. The corresponding 0k0 X-ray topographs reveal extinction contrast consisting of striations parallel to the polar axis. They disappear when the electric field is switched off. The effect is very strong in 0k0 but invisible in h0l reflections. It is present only if the electric field is parallel to the polar axis b. This unusual X-ray topographic contrast is correlated with the proton conduction. It is supposed that, under electric field, an inhomogeneous charge distribution develops, distorting the crystal lattice. Similar experiments on lithium ammonium sulfate also show contrast variations, but of quite different behaviour than before. In this case they result from changes of the ferroelectric domain configuration under electric field. (orig.)

  13. Design of a nondestructive two-in-one instrument for measuring the polarization and energy spectrum at an X-ray FEL facility

    Science.gov (United States)

    Zhang, Qingmin; Deng, Bangjie; Chen, Yuanmiaoliang; Liu, Bochao; Chen, Shaofei; Fan, Jinquan; Feng, Lie; Deng, Haixiao; Liu, Bo; Wang, Dong

    2017-10-01

    The free electron laser (FEL), as a next-generation light source, is an attractive tool in scientific frontier research because of its advantages of full coherence, ultra-short pulse duration, and controllable polarization. Owing to the demand of real-time bunch diagnosis during FEL experiments, precise nondestructive measurements of the polarization and X-ray energy spectrum using one instrument are preferred. In this paper, such an instrument based on the electron time-of-flight technique is proposed. By considering the complexity and nonlinearity, a numerical model in the framework of Geant4 has been developed for optimization. Taking the Shanghai Soft X-ray FEL user facility as an example, its measurement performances' dependence on the critical parameters was studied systematically, and, finally, an optimal design was obtained, achieving resolutions of 0.5% for the polarization degree and 0.3 eV for the X-ray energy spectrum.

  14. Wide field X-ray telescopes: Detecting X-ray transients/afterglows related to gamma ray bursts

    International Nuclear Information System (INIS)

    Hudec, Rene; Pina, Ladislav; Inneman, Adolf; Gorenstein, Paul; Rezek, Tomas

    1999-01-01

    The recent discovery of X-ray afterglows of GRBs opens the possibility of analyses of GRBs by their X-ray detections. However, imaging X-ray telescopes in current use mostly have limited field of view. Alternative X-ray optics geometries achieving very large fields of view have been theoretically suggested in the 70ies but not constructed and used so far. We review the geometries and basic properties of the wide-field X-ray optical systems based on one- and two-dimensional lobster-eye geometry and suggest technologies for their development and construction. First results of the development of double replicated X-ray reflecting flats for use in one-dimensional X-ray optics of lobster eye type are presented and discussed. Optimum strategy for locating GRBs upon their X-ray counterparts is also presented and discussed

  15. Low-angle polarized neutron and X-ray scattering from magnetic nanolayers and nanostructures

    CERN Document Server

    Paul, Amitesh

    2017-01-01

    This research monograph presents the latest results related to the characterization of low dimensional systems. Low-angle polarized neutron scattering and X-ray scattering at grazing incidence are used as the two main techniques to explore various physical phenomena of these systems. Special focus is put on systems like thin film transition metal and rare-earth layers, oxide heterostructures, hybrid systems, self-assembled nanostructures and self-diffusion.  Readers will gain in-depth knowledge about the usage of specular scattering and off-specular scattering techniques. Investigation of in-plane and out-of-plane structures and magnetism with vector magnetometric information is illustrated comprehensively. The book caters to a wide audience working in the field of nano-dimensional magnetic systems and the neutron and X-ray reflectometry community in particular.

  16. PREFACE: Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques Exploring surfaces and buried interfaces of functional materials by advanced x-ray and neutron techniques

    Science.gov (United States)

    Sakurai, Kenji

    2010-12-01

    updates on recent progress and global trends in the field. We planned to cover quite a wide area of surface and buried interface science with x-rays and neutrons. Following a great deal of discussion during the editing process, we have decided to change direction. As we intend to publish similar special issues on a frequent basis, we will not insist on editing this issue as systematic and complete collections of research. Many authors decided to write an ordinary research paper rather than an article including systematic accounts. Due to this change in policy, some authors declined to contribute, and the number of papers is now just 12. However, readers will find that the special issue gives an interesting collection of new original research in surface and buried interface studies with x-rays and neutrons. The 12 papers cover the following research topics: (1) polymer analysis by diffuse scattering; (2) discussion of the electrochemical solid--liquid interface by synchrotron x-ray diffraction; (3) analysis of capped nanodots by grazing incidence small-angle x-ray scattering (GISAXS); (4) discussion of the strain distribution in silicon by high-resolution x-ray diffraction; (5) study of mesoporous structures by a combination of x-ray reflectivity and GISAXS; (6) discussion of energy-dispersive x-ray reflectometry and its applications; (7) neutron reflectivity studies on hydrogen terminated silicon interface; (8) the fabrication and performance of a special mirror for water windows; (9) depth selective analysis by total-reflection x-ray diffraction; (10) nanoparticle thin films prepared by a gas deposition technique; (11) discussion of crystal truncation rod (CTR) scattering of semiconductor nanostructures; (12) magnetic structure analysis of thin films by polarized neutron reflectivity. While not discussed in the present special issue, x-ray and neutron techniques have made great progress. The most important steps forward have been in 2D/3D real-space imaging, and realtime

  17. Multiscale structural study using scanning X-ray microscope

    International Nuclear Information System (INIS)

    Ohsumi, Hiroyuki; Arima, Taka-hisa

    2016-01-01

    Correspondence between structures at the atomic- and meso-scales can be given by scanning X-ray microscopy integrated with polarized X-ray diffractometry. Symmetry is the common structural feature available across multiple hierarchies. This article introduces a symmetry evaluation technique based on polarized X-ray diffractometry and describes two embodiments: chirality domain observation and antiferromagnetic domain observation. Multiscale structural studies would play an important role in uncovering universality of hierarchical structure. (author)

  18. Surface and interface strains studied by x-ray diffraction

    International Nuclear Information System (INIS)

    Akimoto, Koichi; Emoto, Takashi; Ichimiya, Ayahiko

    1998-01-01

    The authors have developed a technique of X-ray diffraction in order to measure strain fields near semiconductor surface and interface. The diffraction geometry is using the extremely asymmetric Bragg-case bulk reflection of a small incident angle to the surface and a large angle exiting from the surface. The incident angle of the X-rays is set near critical angle of total reflection by tuning X-ray energy of synchrotron radiation at the Photon Factory, Japan. For thermally grown-silicon oxide/Si(100) interface, the X-ray intensity of the silicon substrate 311 reflection has been measured. From comparison of the full width at half maxima (FWHM) of X-ray rocking curves of various thickness of silicon oxides, it has been revealed that silicon substrate lattice is highly strained in the thin (less than about 5 nm) silicon oxide/silicon system. In order to know the original silicon surface strain, the authors have also performed the same kind of measurements in the ultra-high vacuum chamber. A clean Si(111) 7x7 surface gives sharper X-ray diffraction peak than that of the native oxide/Si(111) system. From these measurements, it is concluded that the thin silicon oxide film itself gives strong strain fields to the silicon substrates, which may be the reason of the existence of the structural transition layer at the silicon oxide/Si interface

  19. Computation of the Transmitted and Polarized Scattered Fluxes by the Exoplanet HD 189733b in X-Rays

    Energy Technology Data Exchange (ETDEWEB)

    Marin, Frédéric [Astronomical Institute of the Academy of Sciences, Boční II 1401, CZ-14100 Prague (Czech Republic); Grosso, Nicolas, E-mail: frederic.marin@astro.unistra.fr [Université de Strasbourg, CNRS, Observatoire astronomique de Strasbourg, UMR 7550, F-67000 Strasbourg (France)

    2017-02-01

    Thousands of exoplanets have been detected, but only one exoplanetary transit was potentially observed in X-rays from HD 189733A. What makes the detection of exoplanets so difficult in this band? To answer this question, we run Monte-Carlo radiative transfer simulations to estimate the amount of X-ray flux reprocessed by HD 189733b. Despite its extended evaporating atmosphere, we find that the X-ray absorption radius of HD 189733b at 0.7 keV, which is the mean energy of the photons detected in the 0.25–2 keV energy band by XMM-Newton , is ∼1.01 times the planetary radius for an atmosphere of atomic hydrogen and helium (including ions), and produces a maximum depth of ∼2.1% at ∼±46 minutes from the center of the planetary transit on the geometrically thick and optically thin corona. We compute numerically in the 0.25–2 keV energy band that this maximum depth is only of ∼1.6% at ∼±47 minutes from the transit center, and not very sensitive to the metal abundance, assuming that adding metals in the atmosphere would not dramatically change the density–temperature profile. Regarding a direct detection of HD 189733b in X-rays, we find that the amount of flux reprocessed by the exoplanetary atmosphere varies with the orbital phase, spanning between three and five orders of magnitude fainter than the flux of the primary star. Additionally, the degree of linear polarization emerging from HD 189733b is <0.003%, with maximums detected near planetary greatest elongations. This implies that both the modulation of the X-ray flux with the orbital phase and the scatter-induced continuum polarization cannot be observed with current X-ray facilities.

  20. X-ray diffraction study of surface-layer structure in parallel grazing rays

    International Nuclear Information System (INIS)

    Shtypulyak, N.I.; Yakimov, I.I.; Litvintsev, V.V.

    1989-01-01

    An x-ray diffraction method is described for study of thin polycrystalline and amorphous films and surface layers in an extremely asymmetrical diffraction system in parallel grazing rays using a DRON-3.0 diffractometer. The minimum grazing angles correspond to diffraction under conditions of total external reflection and a layer depth of ∼ 2.5-8 nm

  1. The reflected amplitude ratio of multilayers and superlattice describe the dynamical diffraction of x-rays

    International Nuclear Information System (INIS)

    Bhatti, Q.A.; Mangi, F.A.

    2006-01-01

    Calculating the rocking curves of complicated layered structures, such as non-ideal super lattices on perfect crystals are clearly exposed with observed diffraction profile. Recursion formulas for calculating reflected amplitude ratio of multilayer and super lattices have been involved from the Takagi-Taupin differential equation, which describes the dynamical diffraction of X-rays in deformed crystal. The Kinematical theory can computing time only in case of ideal superlattice for which geometric series can be used but the reflectivity must be below 10 % so that multiple reflections can be neglected for a perfect crystal of arbitrary thickness the absorption at the centre of the dynamical reflection is found to be proportional to the square root of the reflectivity. Sputter- deposited periodic multilayers of tungsten and carbon can be considered as an artificial crystal, for which dynamical X-rays diffraction calculations give the result very similar to those of macroscopic optical description in terms of the complex index of refraction and Frensnel relation coefficient. (author)

  2. Fast helicity switching of x-ray circular polarization at beamline P09 at PETRA III

    Energy Technology Data Exchange (ETDEWEB)

    Strempfer, J., E-mail: Joerg.Strempfer@desy.de; Mardegan, J. R. L.; Francoual, S.; Veiga, L. S. I.; Spitzbart, T.; Zink, H. [Deutsches Elektronen Synchrotron (DESY), Notkestrasse 85, 22603 Hamburg (Germany); Bouchenoire, L. [XMaS, ESRF, 6 rue Jules Horowitz, BP220, Grenoble 38043 (France); Department of Physics, University of Liverpool, Liverpool, L69 7ZE (United Kingdom)

    2016-07-27

    At the resonant scattering and diffraction beamline P09 at PETRA III/DESY, polarization manipulation in the X-ray energy range 3-13 keV is possible using wave-plates. Recently, fast flipping of circular polarization helicity using the Raspberry Pi controlled FPGA (PiLC) device developed at DESY and dedicated piezo-electric flippers has been commissioned. Functionality of the PiLC for XMCD and first XMCD measurements at the Fe K-and Dy-L{sub 3} absorption edges are presented.

  3. X-ray image signal generator

    International Nuclear Information System (INIS)

    Dalton, B.L.; Lill, B.H.

    1981-01-01

    This patent claim on behalf on EMI Ltd. relates to a flat plate X-ray detector which uses a plate detector exhibiting so-called permanent induced electric polarization in response to a pattern of radiation emergent from a patient to generate a polarization pattern which is scanned by means of a laser to cause discharge of the polarization through the plate and so generate electric signals representative of the X-ray image of the patient. In addition a second laser operating at a different wavelength e.g. infra-red, also scans or floods the plate detector to move 'dark polarisation'. The plate detector may be a phosphor screen or a phosphor screen in combination with a scintillator. (author)

  4. The intermediate polar GK Persei: An unstable relation of the X-ray and the optical intensities in a series of outbursts

    Science.gov (United States)

    Šimon, V.

    2015-03-01

    Context. GK Per is an intermediate polar that has been displaying dwarf nova outbursts since the middle of the twentieth century. Aims: I analyzed a series of such outbursts in the optical and X-ray bands. I pay attention to the relation of intensities of the optical and X-ray emissions, and its reproducibility in a series of these consecutive outbursts. Methods: This analysis uses the data from the BAT/Swift, ASM/RXTE, AAVSO, and AFOEV databases. It investigates the relation of the time evolution of the profiles of outbursts in the individual bands (hard X-ray, medium/hard X-ray, and optical). Results: This analysis shows that the X-ray intensity steeply rises only in the start of the optical outburst and steeply declines only when the optical outburst comes to its end. However, the 1.5-50 keV band intensity saturates and balances on a plateau during the outburst. (The longer the outburst, the longer its plateau.) The peak X-ray intensities of this series display a significantly narrower range than the optical ones (a factor of about two versus a factor of about eight). This implies a discrepancy between the mass flow through the disk and the production of the X-ray emission via bremsstrahlung at the polar caps of the white dwarf. This discrepancy is the largest in the time of the peak optical intensity when the whole disk (or at least its inner part) is in the hot state and the flow of matter through the disk is the greatest. This study shows that a series of outbursts constitutes more general properties of this discrepancy. I argue that the saturation of the X-ray luminosity in outburst cannot be caused by a dominant increase in X-ray absorption. In the interpretation, large structural changes of the accreting regions at the magnetic poles of the white dwarf occur during the outburst. A buried shock proposed by some authors for polars is also promising for explaining the X-ray light curves of outbursts of GK Per. This research made use of the BAT/Swift, ASM

  5. In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

    International Nuclear Information System (INIS)

    Bertram, F.; Evertsson, J.; Messing, M. E.; Mikkelsen, A.; Lundgren, E.; Zhang, F.; Pan, J.; Carlà, F.; Nilsson, J.-O.

    2014-01-01

    We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.

  6. X-Ray Topography of the Subsurface Crystal Layers in the Skew Asymmetric Reflection Geometry

    Directory of Open Access Journals (Sweden)

    Swiątek Z.

    2016-12-01

    Full Text Available The technique of X ray topography with the asymmetric reflection geometry of X-ray diffraction presented in this paper as useful tool for structural characterization of materials, particularly, epitaxial thin films and semiconductor multi-layered crystal systems used for the optoelectronic devices. New possibilities of this technique for a layer-by-layer visualization of structural changes in the subsurface crystal layers are demonstrated for semiconductors after various types of surface treatment, such as chemical etching, laser irradiation and ion implantation.

  7. Broad-band hard X-ray reflectors

    DEFF Research Database (Denmark)

    Joensen, K.D.; Gorenstein, P.; Hoghoj, P.

    1997-01-01

    Interest in optics for hard X-ray broad-band application is growing. In this paper, we compare the hard X-ray (20-100 keV) reflectivity obtained with an energy-dispersive reflectometer, of a standard commercial gold thin-film with that of a 600 bilayer W/Si X-ray supermirror. The reflectivity...... of the multilayer is found to agree extraordinarily well with theory (assuming an interface roughness of 4.5 Angstrom), while the agreement for the gold film is less, The overall performance of the supermirror is superior to that of gold, extending the band of reflection at least a factor of 2.8 beyond...... that of the gold, Various other design options are discussed, and we conclude that continued interest in the X-ray supermirror for broad-band hard X-ray applications is warranted....

  8. Analysis of heavy metals and minerals elements in the turmeric using Total-Reflection X-ray Fluorescence analysis technique and Atomic Absorption Spectrometry

    International Nuclear Information System (INIS)

    Andriamisetra, V.M.Z.

    2014-01-01

    Currently, many studies demonstrate anti-cancer and anti-inflammatory benefits of turmeric. The aims of this work is to perform analysis of metals such as calcium, chromium, manganese, iron, cobalt, nickel, copper, zinc, arsenic, bromine, rubidium, strontium, cadmium and lead in the turmeric collected from various places in Madagascar. The analysis by total reflection X-ray fluorescence technique is used to determine the concentrations of heavy metals, while the atomic absorption spectrometry is used for the determination of trace elements. Analysis results show that the concentration of calcium in the turmeric is very high, its average concentration is 1025.8 mg.kg -1 . The average concentrations of manganese, of copper and of iron are respectively 44.7 mg.kg -1 ; 19.7 mg.kg -1 and 53.6 mg.kg -1 . The average concentrations of zinc, of rubidium and of strontium are respectively 17.3 mg.kg -1 ; 35.2 mg.kg -1 and 21.7 mg.kg -1 [fr

  9. Determination of metals by total reflection X-ray fluorescence and evaluation of toxicity of a river impacted by coal mining in the south of Brazil.

    Science.gov (United States)

    Lattuada, R M; Menezes, C T B; Pavei, P T; Peralba, M C R; Dos Santos, J H Z

    2009-04-30

    Metal (Fe, Mn, Zn, Ni, Cd, and Pb) concentrations in the region of Criciuma (Brazil), a region impacted by coal mining, were determined in water and sediments using total reflection X-ray fluorescence (TXRF) spectroscopy. Samples were collected from the Mãe Luzia River (south Brazil) at five different stations, from the source down to the river mouth (Ararangua estuary). Water and sediment toxicity were also evaluated using bioassays with Daphnia magna as the bioindicator. The metal present in the highest concentrations both in water (1.3-11 mg L(-1)) and in sediments (34-142 mg L(-1)) was iron. Results suggest an influence of coal mining on the aquatic receptors, showing a clear relationship between metal content (mostly Fe) and ecotoxicity.

  10. Determination of trace elements in freshwater rotifers and ciliates by total reflection X-ray fluorescence spectrometry

    Science.gov (United States)

    Woelfl, S.; Óvári, M.; Nimptsch, J.; Neu, T. R.; Mages, M.

    2016-02-01

    Element determination in plankton is important for the assessment of metal contamination of aquatic environments. Until recently, it has been difficult to determine elemental content in rotifers or ciliates derived from natural plankton samples because of the difficulty in handling and separation of these fragile organisms. The aim of this study was to evaluate methods for separation of rotifers and large ciliates from natural plankton samples (μg range dry weight) and subsequent analysis of their elemental content using total-reflection X-ray fluorescence spectrometry (TXRF). Plankton samples were collected from different aquatic environments (three lakes, one river) in Chile, Argentina and Hungary. From one to eighty specimens of five rotifer species (Brachionus calyciflorus, Brachionus falcatus, Asplanchna sieboldii, Asplanchna sp., Philodina sp.) and four to twelve specimens of one large ciliate (Stentor amethystinus) were prepared according to the dry method originally developed for microcrustaceans, and analysed by TRXF following in situ microdigestion. Our results demonstrated that it possible to process these small and fragile organisms (individual dry mass: 0.17-9.39 μg ind- 1) via careful washing and preparation procedures. We found species-dependent differences of the element mass fractions for some of the elements studied (Cr, Mn, Fe, Ni, Cu, Zn, As, Pb), especially for Cu, Fe and Mn. One large rotifer species (A. sieboldii) also showed a negative correlation between individual dry weight and the element content for Pb, Ni and Cr. We conclude that our application of the in situ microdigestion-TRXF method is suitable even for rotifers and ciliates, greatly expanding the possibilities for use of plankton in biomonitoring of metal contamination in aquatic environments.

  11. Biomonitoring of environmental pollution using growth tree rings of Tipuana tipu: Quantification by synchrotron radiation total reflection X-ray fluorescence

    Science.gov (United States)

    Geraldo, S. M.; Canteras, F. B.; Moreira, S.

    2014-02-01

    Currently, many studies use the bioindicators to qualitatively and/or quantitatively measure pollution. The analyses of tree growth rings represent one such bioindicator as changes in the environment are often recorded as impressions in the wood. The main objective of the present study is to examine the growth rings of Tipuana tipu - a member of the Leguminosae family that is native to Argentina and Bolivia and was introduced in Brazil as an ornamental plant - for potentially toxic elements. T. tipu is one of the most common trees in the urban landscape of Sao Paulo city and would provide an accurate reflection of environment changes. Tree ring samples previously dated using Synchrotron Radiation Total Reflection X-ray Fluorescence were collected from strategic locations in Sao Paulo. These locations include Piracicaba (SP) that has little access and small flow traffic and the campus of the University of São Paulo. Some trace elements present concentrations higher than considered as normal in some periods. In São Paulo city, samples collected from the campus of University of São Paulo (Butantã), showed the highest toxicity, with concentrations above the tolerable limit for the elements: Cr, Cu, and Pb. For the samples collected in Piracicaba city, one sample presented highest concentrations for the majority of the elements when compared to the other four samples collected at the same place, exceeding the toxicity limits for: Cr, Ni, Cu, and Pb.

  12. Identification of Hard X-ray Sources in Galactic Globular Clusters: Simbol-X Simulations

    Science.gov (United States)

    Servillat, M.

    2009-05-01

    Globular clusters harbour an excess of X-ray sources compared to the number of X-ray sources in the Galactic plane. It has been proposed that many of these X-ray sources are cataclysmic variables that have an intermediate magnetic field, i.e. intermediate polars, which remains to be confirmed and understood. We present here several methods to identify intermediate polars in globular clusters from multiwavelength analysis. First, we report on XMM-Newton, Chandra and HST observations of the very dense Galactic globular cluster NGC 2808. By comparing UV and X-ray properties of the cataclysmic variable candidates, the fraction of intermediate polars in this cluster can be estimated. We also present the optical spectra of two cataclysmic variables in the globular cluster M 22. The HeII (4868 Å) emission line in these spectra could be related to the presence of a magnetic field in these objects. Simulations of Simbol-X observations indicate that the angular resolution is sufficient to study X-ray sources in the core of close, less dense globular clusters, such as M 22. The sensitivity of Simbol-X in an extended energy band up to 80 keV will allow us to discriminate between hard X-ray sources (such as magnetic cataclysmic variables) and soft X-ray sources (such as chromospherically active binaries).

  13. X-ray fluorescence beamline at LNLS: components and some associated techniques

    International Nuclear Information System (INIS)

    Perez, CArlos A.; Radtke, Martin; Perez, Carlos; Tolentino, Helio; Vicentin, Flavio; Sanchez, Hector Jorge; Perez, Roberto D.

    1997-01-01

    Full text. In this work a general description of the Total Reflection X-Ray Fluorescence (TXRF) and the X-Ray Fluorescence Microprobe (XRFM) is presented. Components, equipment and experimental stations for the x-ray fluorescence beamline are described, regarding to the techniques mentioned above. Results from the simulations of a pair bended mirrors in a Kirkpatrick-Baez configuration, are shown. The simulations were performed with Shadow program. (author)

  14. Total reflection X-ray fluorescence analysis of trace-elements in candies marketed in Mexico

    International Nuclear Information System (INIS)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2010-01-01

    Trace metals concentrations in food are significant for nutrition, due either to their nature or toxicity. Sweets, including chewing gum and candies, are not exactly a food, but they usually are unwearied consumed by children, the most vulnerable age-group to any kind of metal contamination in the food chain. The presence of relatively high concentrations of heavy metals such as Lead elicits concern since children are highly susceptible to heavy metals poisoning. Trace-metals concentrations were determined for six different flavors of a Mexican candy by means of Total X-ray Fluorescence Spectrometry. Triplicate samples of the various candy's flavours (strawberry, pineapple, lemon, blackberry, orange and chilli) were digested in 8 mL of a mix of supra-pure HNO 3 and H 2 O 2 (6 mL: 2 mL) in a microwave oven MARS-X. Results show the presence of essential and toxic elements such as Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Pb. All metal concentrations were higher and significantly different (α = 0.05) in chilli candy, compared to other candy flavours. Lead concentration fluctuated in the range of 0.102 to 0.342 μg g -1 . A discussion about risk consumption and concentration allowed by Mexican and International Norms is made. As a part of the Quality Control Program, a NIST standard of 'Citrus Leaves' and a blank were treated in the same way.

  15. Total reflection X-ray fluorescence analysis of trace-elements in candies marketed in Mexico

    Energy Technology Data Exchange (ETDEWEB)

    Martinez, T., E-mail: tmc@servidor.unam.m [Facultad de Quimica, Departamento de Quimica Inorganica y Nuclear. Universidad Nacional Autonoma de Mexico, Mexico D.F. 04510 (Mexico); Lartigue, J. [Facultad de Quimica, Departamento de Quimica Inorganica y Nuclear. Universidad Nacional Autonoma de Mexico, Mexico, D.F. 04510 (Mexico); Zarazua, G.; Avila-Perez, P. [National Institute of Nuclear Research. Ocoyoacac, Edo. de Mexico, 05045 (Mexico); Navarrete, M. [Facultad de Quimica, Departamento de Quimica Inorganica y Nuclear. Universidad Nacional Autonoma de Mexico, Mexico, D.F. 04510 (Mexico); Tejeda, S. [National Institute of Nuclear Research. Ocoyoacac, Edo. de Mexico, 05045 (Mexico)

    2010-06-15

    Trace metals concentrations in food are significant for nutrition, due either to their nature or toxicity. Sweets, including chewing gum and candies, are not exactly a food, but they usually are unwearied consumed by children, the most vulnerable age-group to any kind of metal contamination in the food chain. The presence of relatively high concentrations of heavy metals such as Lead elicits concern since children are highly susceptible to heavy metals poisoning. Trace-metals concentrations were determined for six different flavors of a Mexican candy by means of Total X-ray Fluorescence Spectrometry. Triplicate samples of the various candy's flavours (strawberry, pineapple, lemon, blackberry, orange and chilli) were digested in 8 mL of a mix of supra-pure HNO{sub 3} and H{sub 2}O{sub 2} (6 mL: 2 mL) in a microwave oven MARS-X. Results show the presence of essential and toxic elements such as Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Pb. All metal concentrations were higher and significantly different ({alpha} = 0.05) in chilli candy, compared to other candy flavours. Lead concentration fluctuated in the range of 0.102 to 0.342 {mu}g g{sup -1}. A discussion about risk consumption and concentration allowed by Mexican and International Norms is made. As a part of the Quality Control Program, a NIST standard of 'Citrus Leaves' and a blank were treated in the same way.

  16. Total reflection X-ray fluorescence analysis of trace-elements in candies marketed in Mexico

    Science.gov (United States)

    Martinez, T.; Lartigue, J.; Zarazua, G.; Avila-Perez, P.; Navarrete, M.; Tejeda, S.

    2010-06-01

    Trace metals concentrations in food are significant for nutrition, due either to their nature or toxicity. Sweets, including chewing gum and candies, are not exactly a food, but they usually are unwearied consumed by children, the most vulnerable age-group to any kind of metal contamination in the food chain. The presence of relatively high concentrations of heavy metals such as Lead elicits concern since children are highly susceptible to heavy metals poisoning. Trace-metals concentrations were determined for six different flavors of a Mexican candy by means of Total X-ray Fluorescence Spectrometry. Triplicate samples of the various candy's flavours (strawberry, pineapple, lemon, blackberry, orange and chilli) were digested in 8 mL of a mix of supra-pure HNO 3 and H 2O 2 (6 mL: 2 mL) in a microwave oven MARS-X. Results show the presence of essential and toxic elements such as Ti, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, Sr, and Pb. All metal concentrations were higher and significantly different ( α = 0.05) in chilli candy, compared to other candy flavours. Lead concentration fluctuated in the range of 0.102 to 0.342 μg g - 1 . A discussion about risk consumption and concentration allowed by Mexican and International Norms is made. As a part of the Quality Control Program, a NIST standard of "Citrus Leaves" and a blank were treated in the same way.

  17. Resonant inelastic X-ray spectroscopy of atoms and simple molecules: Satellite features and dependence on energy detuning and photon polarization

    Energy Technology Data Exchange (ETDEWEB)

    Žitnik, M., E-mail: matjaz.zitnik@ijs.si [Jožef Stefan Institute, P.O. Box 3000, SI-1001 Ljubljana (Slovenia); University of Ljubljana, Faculty of Mathematics and Physics, Jadranska 21, SI-1000 Ljubljana (Slovenia); Kavčič, M.; Bohinc, R.; Bučar, K.; Mihelič, A. [Jožef Stefan Institute, P.O. Box 3000, SI-1001 Ljubljana (Slovenia); Cao, W. [Research Centre for Molecular Materials, University of Oulu, P.O. Box 3000, FIN-90014 Oulu (Finland); Guillemin, R.; Journel, L.; Marchenko, T.; Carniato, S.; Kawerk, E. [Sorbonne Universités, UPMC Univ Paris 06, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France); CNRS, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France); Piancastelli, M.N. [Sorbonne Universités, UPMC Univ Paris 06, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France); CNRS, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France); Department of Physics and Astronomy, Uppsala University, P.O. Box 516, 75120 Uppsala (Sweden); Simon, M. [Sorbonne Universités, UPMC Univ Paris 06, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France); CNRS, UMR 7614, Laboratoire de Chimie Physique Matière et Rayonnement, F-75005 Paris (France)

    2015-10-15

    We summarize recent results dealing with high resolution (resonant) X-ray spectroscopy of atomic and molecular targets in the tender X-ray energy region. We comment on advantages, new possibilities and problems related to RIXS spectroscopy with respect to the standard photoabsorption technique, where scanning the probe energy is the only option. In particular, three research areas are covered: X-ray emission mediated by energy dependent photoabsorption to multi-electron excited states, the Cl K core-hole clock studies exemplified by systematic study of chloro(fluoro)-hydrocarbon targets and the polarization dependent X-ray emission studies. Due to its spectral selectivity and simultaneous detection capability, high resolution wavelength dispersive X-ray spectroscopy has the capability to resolve structural and dynamical properties of matter within new instrumentation frontiers.

  18. Resonant inelastic X-ray spectroscopy of atoms and simple molecules: Satellite features and dependence on energy detuning and photon polarization

    International Nuclear Information System (INIS)

    Žitnik, M.; Kavčič, M.; Bohinc, R.; Bučar, K.; Mihelič, A.; Cao, W.; Guillemin, R.; Journel, L.; Marchenko, T.; Carniato, S.; Kawerk, E.; Piancastelli, M.N.; Simon, M.

    2015-01-01

    We summarize recent results dealing with high resolution (resonant) X-ray spectroscopy of atomic and molecular targets in the tender X-ray energy region. We comment on advantages, new possibilities and problems related to RIXS spectroscopy with respect to the standard photoabsorption technique, where scanning the probe energy is the only option. In particular, three research areas are covered: X-ray emission mediated by energy dependent photoabsorption to multi-electron excited states, the Cl K core-hole clock studies exemplified by systematic study of chloro(fluoro)-hydrocarbon targets and the polarization dependent X-ray emission studies. Due to its spectral selectivity and simultaneous detection capability, high resolution wavelength dispersive X-ray spectroscopy has the capability to resolve structural and dynamical properties of matter within new instrumentation frontiers.

  19. Analysis of some chosen elements of cerebrospinal fluid and serum in amyotrophic lateral sclerosis patients by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Ostachowicz, B.; Lankosz, M.; Tomik, B.; Adamek, D.; Wobrauschek, P.; Streli, C.; Kregsamer, P.

    2006-01-01

    Trace elements play an important role in the human central nervous system. Significant variations of the concentration of trace elements in body fluids may occur in neurodegenerative diseases. In the present work an investigation of the elemental composition of the serum, and the cerebrospinal fluid in amyotrophic lateral sclerosis patients and a control group was performed. For the analysis of the body fluids Total reflection X-ray Fluorescence (TXRF) spectrometry was used. The samples were taken during routine diagnostic procedures. Na, Mg, Cl, K, Ca, Cu, Zn, and Br were determined in both fluids. In order to validate the results of analysis a serum standard reference material was measured. A t-test was applied to check if the mean concentrations of the elements are different for ALS and the control group. For the serum samples higher values for Br were found in the ALS group, for the cerebrospinal fluid lower values of Na, Mg and Zn as well as higher Ca values were found in the ALS group compared to the control group

  20. Analysis of some chosen elements of cerebrospinal fluid and serum in amyotrophic lateral sclerosis patients by total reflection X-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Ostachowicz, B. [Department of Radiometric Analyses, Faculty of Physic and Applied Computer Science, AGH, University of Science and Technology, Cracow (Poland); Lankosz, M. [Department of Radiometric Analyses, Faculty of Physic and Applied Computer Science, AGH, University of Science and Technology, Cracow (Poland); Tomik, B. [Institute of Neurology, Collegium Medicum, Jagiellonian University, Cracow (Poland); Adamek, D. [Institute of Neurology, Collegium Medicum, Jagiellonian University, Cracow (Poland); Wobrauschek, P. [Atominstitut, Vienna University of Technology, Vienna (Austria); Streli, C. [Atominstitut, Vienna University of Technology, Vienna (Austria)]. E-mail: streli@ati.ac.at; Kregsamer, P. [Atominstitut, Vienna University of Technology, Vienna (Austria)

    2006-11-15

    Trace elements play an important role in the human central nervous system. Significant variations of the concentration of trace elements in body fluids may occur in neurodegenerative diseases. In the present work an investigation of the elemental composition of the serum, and the cerebrospinal fluid in amyotrophic lateral sclerosis patients and a control group was performed. For the analysis of the body fluids Total reflection X-ray Fluorescence (TXRF) spectrometry was used. The samples were taken during routine diagnostic procedures. Na, Mg, Cl, K, Ca, Cu, Zn, and Br were determined in both fluids. In order to validate the results of analysis a serum standard reference material was measured. A t-test was applied to check if the mean concentrations of the elements are different for ALS and the control group. For the serum samples higher values for Br were found in the ALS group, for the cerebrospinal fluid lower values of Na, Mg and Zn as well as higher Ca values were found in the ALS group compared to the control group.

  1. Characterization by Total Reflection X-ray Fluorescence Spectrometry of filtered water into the cave under the Sun Pyramid in Teotihuacan City

    Energy Technology Data Exchange (ETDEWEB)

    Martinez, T. [National University of Mexico, Faculty of Chemistry, Building D, CU, O4510, Mexico, D.F. (Mexico)], E-mail: tmc@servidor.unam.mx; Zarazua, G.; Avila-Perez, P. [National Institute of Nuclear Research, Carr. Mexico-Toluca Km 36.5, 52045, Salazar, Ocoyoacac, Edo. de Mexico (Mexico); Juarez, F. [National University of Mexico, Institute of Geophysics, Circuito Institutos, CU, 04510 Mexico, D.F. (Mexico); Cabrera, L. [National University of Mexico, Faculty of Chemistry, Building D, CU, O4510, Mexico, D.F. (Mexico); Martinez, G. [Coordinacion Nacional de Conservacion del Patrimonio Cultural, Xicotencatl y General Anaya s/n., 04120, Mexico, D.F. (Mexico)

    2008-12-15

    Teotihuacan (50 km north-east Mexico City) was the most important ancient city in Mesoamerica and it flourished 200-750 AC. It is situated in the central part of the Valley of Teotihuacan, in Central Mexico. This study was carried out in the 102 m-long cave under the largest single construction, the massive Sun Pyramid, being located on the east side of the 'Avenue of the Dead', in the northern half-part of the city. The study shows the results of Total Reflection X-ray Fluorescence Spectrometry analysis and other techniques of a water sample obtained from the inside of the cave. The inside temperature ranged between 19 and 22 deg. C; relative humidity was between 98 and 99.3%; water-dropping velocity (water de-sorption capability) was 13.5 {mu}L min{sup -1}. Water samples from wells around the site were analyzed too. Metal concentration in all of the water samples matches the characteristics of the sampling site, well's depth, soil and minerals.

  2. Characteristics of soft X-ray lens

    International Nuclear Information System (INIS)

    Qin Yi

    2007-12-01

    A soft X-lens was devised with waveguide X-ray optics of total external reflection (TER). The lens consists of a stack of 1 387 TER waveguides with inner diameter of 0.45 mm and outer diameter of 0.60 mm. With the help of plasma sources of soft X-ray radiation, high density of pure soft X-ray radiation (without plasma expansion fragments) with broad-band spectral range can be obtained at the focus of the lens. As laser-plasma is considered, the radiation density of 1.3 x 10 5 W/cm 2 is obtained, the transmission coefficient is 18.6%, the ratio of the density at the focus with and without the lens is 1000 and the radiation capture is 28.9 degree. The density of 0.5 TW/cm 2 can be obtained as far as Qiang-Guang I facility is considered. (authors)

  3. Unoccupied density of states of La2–xSrxNiO4+δ studied by polarization-dependent x-ray-absorption spectroscopy and bremsstrahlung isochromat spectroscopy

    NARCIS (Netherlands)

    Kuiper, P.; Elp, J. van; Sawatzky, G.A.; Fujimori, A.; Hosoya, S.; Leeuw, D.M. de

    1991-01-01

    Oxygen 1s x-ray-absorption measurements of La2–xSrxNiO4+δ (0≤x≤1.15) are presented, together with O 1s polarization-dependent x-ray absorption on single-crystal La1.85Sr0.15NiO4. It is concluded that the charge-compensating holes have mainly oxygen 2p character. The Ni 3d9 final states reached

  4. Analysis in crab tissues and in sediment of estuary from Iguape (Sao Paulo, Brazil) by total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Salvador, Marcos J.; Sawazaki, David T.A.; Zucchi, Orgheda L.A. Domingues; Vives, Ana Elisa S. de; Hattori, Gustavo Y.

    2007-01-01

    We report the use of Synchrotron Radiation Total Reflection X-Ray Fluorescence analysis (SR-TXRF) as a technique for macro, micro and trace elements determination in the tissues of the crab Ulcides cordatus and in the sediments from the Iguape estuary (Sao Paulo, Brazil) for environmental pollution control and toxicological evaluation. The analyses were performed on the U. cordatus (muscles and hepatopancreas) and on sediments from 24 sites of the Iguape estuary (Sao Paulo, Brazil). Tissues and sediments samples were analyzed by SRTXRF after digestion in an open system, using Ga as internal standard. Potassium (K), Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Sr, and Ba were the elements detected in crab hepatopancreas at concentration ranging from 0.516 (Mn) to 2061 (K) mug/g. Muscles samples presented the elements K, Ca, Ti, V, Cr, Fe, Ni, Cu, Zn, Br and Sr at concentrations ranging from 0.043 (Ni) to 1917 (K) mug/g. Potassium (K), Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Rb, Sr, Sn, Ce, and Pb were the elements detected in the sediment samples with concentration between 3.8 (Cu) and 14628 (Fe)mug/g. (author)

  5. Analysis in crab tissues and in sediment of estuary from Iguape (Sao Paulo, Brazil) by total reflection X-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Salvador, Marcos J. [Universidade do Vale do Paraiba (UNIVAP), Sao Jose dos Campos, SP (Brazil)], E-mail: mjsalvador1531@yahoo.com.br; Sawazaki, David T.A.; Zucchi, Orgheda L.A. Domingues [Universidade de Sao Paulo (USP), Ribeirao Preto, SP (Brazil). Faculdade de Ciencias Farmaceuticas], E-mail: david_tatsuo@hotmail.com, E-mail: olzucchi@fcfrp.usp.br; Vives, Ana Elisa S. de [Universidade Metodista de Piracicaba (UNIMEP), Santa Barbara D' Oeste, SP (Brazil). Faculdade de Engenharia Civil, Arquitetura e Urbanismo], E-mail: aesvives@unimep.br; Hattori, Gustavo Y. [Universidade Federal do Amazonas, Benjamin Constant (Brazil). Faculdade de Ciencias Agrarias], E-mail: hattori@ufam.edu.br

    2007-07-01

    We report the use of Synchrotron Radiation Total Reflection X-Ray Fluorescence analysis (SR-TXRF) as a technique for macro, micro and trace elements determination in the tissues of the crab Ulcides cordatus and in the sediments from the Iguape estuary (Sao Paulo, Brazil) for environmental pollution control and toxicological evaluation. The analyses were performed on the U. cordatus (muscles and hepatopancreas) and on sediments from 24 sites of the Iguape estuary (Sao Paulo, Brazil). Tissues and sediments samples were analyzed by SRTXRF after digestion in an open system, using Ga as internal standard. Potassium (K), Ca, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, Sr, and Ba were the elements detected in crab hepatopancreas at concentration ranging from 0.516 (Mn) to 2061 (K) mug/g. Muscles samples presented the elements K, Ca, Ti, V, Cr, Fe, Ni, Cu, Zn, Br and Sr at concentrations ranging from 0.043 (Ni) to 1917 (K) mug/g. Potassium (K), Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Rb, Sr, Sn, Ce, and Pb were the elements detected in the sediment samples with concentration between 3.8 (Cu) and 14628 (Fe)mug/g. (author)

  6. Development and characterization of femtosecond laser driven soft x-ray lasers

    International Nuclear Information System (INIS)

    Bettaibi, I.

    2005-06-01

    Coherent soft x-ray sources have an important potential for scientific, medical and industrial applications. The development of high intensity laser systems allowed the realization of new coherent and fast soft x-ray sources like high order harmonic generation and soft x-ray lasers. These sources are compact, cheaper than traditional sources such as synchrotrons, and are thus interesting. This thesis presents the study of a new soft x-ray laser pumped by a femto-second laser beam working at 10 Hz. The circularly polarized ultra intense laser is longitudinally focused in a cell filled with xenon or krypton, to obtain the amplification of two lasing lines at 41.8 nm and 32.8 nm in Pd-like xenon and Ni-like krypton respectively. We carry out an experimental and numerical study of the source to understand the importance of different parameters such as the laser intensity and polarization, the gas pressure and the cell length. We have also spatially and temporally characterized the soft x-ray laser beam. To compensate the refraction of the driving laser we have investigated guiding techniques consisting in creating a plasma channel by electric discharge or using the multiple reflections of the driving laser on the internal walls of the dielectric tubes of sapphire or glass. A spectacular improvement of the source performances has been observed in both cases. Finally, we present a preliminary study on a different x-ray scheme: the inner shell photo pumping of neutral atoms. We have developed an optical system, which should create the appropriate conditions for the realisation of short wavelength x-ray amplifier. (author)

  7. Hygrothermal degradation of (3-glycidoxypropyl)trimethoxysilane films studied by neutron and X-ray reflectivity and attenuated total reflection infrared spectroscopy

    International Nuclear Information System (INIS)

    Tallant, David Robert; Garcia, Manuel Joseph; Majewski, Jaroslaw; Kent, Michael Stuart; Yim, Hyun

    2005-01-01

    Thin films of organosilanes have great technological importance in the areas of adhesion promotion, durability, and corrosion resistance. However, it is well-known that water can degrade organosilane films, particularly at elevated temperatures. In this work, X-ray and neutron reflectivity (XR and NR) were combined with attenuated total reflection infrared (ATR-IR) spectroscopy to study the chemical and structural changes within thin films of (3-glycidoxypropyl)trimethoxysilane (GPS) after exposure for various periods of time to air saturated with either D 2 O or H 2 O at 80 C. For NR and XR, ultrathin (∼100 (angstrom)) films were prepared by spin-coating. Both D 2 O and H 2 O provide neutron scattering contrast with GPS. Variations in the neutron scattering length density (SLD) profiles (a function of mass density and atomic composition) with conditioning time were measured after drying the samples out and also swelled with H 2 O or D 2 O vapor at room temperature. For samples that were dried out prior to measurement, little or no change was observed for H 2 O conditioning up to 3.5 days, but large changes were observed after 30 days of conditioning. The range of conditioning time for this structural change was narrowed to between 4 and 10 days with XR. The SLD profiles indicated that the top portion of the GPS film was transformed into a thick low-density layer after conditioning, but the bottom portion showed little structural change. A previous NR study of as-prepared GPS films involving swelling with deuterated nitrobenzene showed that the central portion of the film has much lower cross-link density than the region nearest the substrate. The present data show that the central portion also swells to a much greater extent with water and hydrolyzes more rapidly. The chemical degradation mechanism was identified by IR as hydrolysis of siloxane bonds. For ATR-IR, GPS films were prepared by dip-coating, which resulted in a greater and more variable thickness than

  8. Circular dichroism measurements at an x-ray free-electron laser with polarization control

    Energy Technology Data Exchange (ETDEWEB)

    Hartmann, G.; Shevchuk, I.; Walter, P.; Viefhaus, J. [Deutsches Elektronen-Synchrotron, Notkestraße 85, 22607 Hamburg (Germany); Lindahl, A. O. [PULSE at Stanford, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Knie, A. [Institut für Physik, University of Kassel, Heinrich-Plett-Str. 40, 34132 Kassel (Germany); Hartmann, N.; Lutman, A. A.; MacArthur, J. P.; Glownia, J. M.; Helml, W.; Huang, Z.; Marinelli, A.; Nuhn, H.-D.; Moeller, S.; Coffee, R. N.; Ilchen, M., E-mail: markus.ilchen@xfel.eu [SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States); Buck, J.; Galler, A.; Liu, J. [European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg (Germany); and others

    2016-08-15

    A non-destructive diagnostic method for the characterization of circularly polarized, ultraintense, short wavelength free-electron laser (FEL) light is presented. The recently installed Delta undulator at the LCLS (Linac Coherent Light Source) at SLAC National Accelerator Laboratory (USA) was used as showcase for this diagnostic scheme. By applying a combined two-color, multi-photon experiment with polarization control, the degree of circular polarization of the Delta undulator has been determined. Towards this goal, an oriented electronic state in the continuum was created by non-resonant ionization of the O{sub 2} 1s core shell with circularly polarized FEL pulses at hν ≃ 700 eV. An also circularly polarized, highly intense UV laser pulse with hν ≃ 3.1 eV was temporally and spatially overlapped, causing the photoelectrons to redistribute into so-called sidebands that are energetically separated by the photon energy of the UV laser. By determining the circular dichroism of these redistributed electrons using angle resolving electron spectroscopy and modeling the results with the strong-field approximation, this scheme allows to unambiguously determine the absolute degree of circular polarization of any pulsed, ultraintense XUV or X-ray laser source.

  9. Circular dichroism measurements at an x-ray free-electron laser with polarization control

    Science.gov (United States)

    Hartmann, G.; Lindahl, A. O.; Knie, A.; Hartmann, N.; Lutman, A. A.; MacArthur, J. P.; Shevchuk, I.; Buck, J.; Galler, A.; Glownia, J. M.; Helml, W.; Huang, Z.; Kabachnik, N. M.; Kazansky, A. K.; Liu, J.; Marinelli, A.; Mazza, T.; Nuhn, H.-D.; Walter, P.; Viefhaus, J.; Meyer, M.; Moeller, S.; Coffee, R. N.; Ilchen, M.

    2016-08-01

    A non-destructive diagnostic method for the characterization of circularly polarized, ultraintense, short wavelength free-electron laser (FEL) light is presented. The recently installed Delta undulator at the LCLS (Linac Coherent Light Source) at SLAC National Accelerator Laboratory (USA) was used as showcase for this diagnostic scheme. By applying a combined two-color, multi-photon experiment with polarization control, the degree of circular polarization of the Delta undulator has been determined. Towards this goal, an oriented electronic state in the continuum was created by non-resonant ionization of the O2 1s core shell with circularly polarized FEL pulses at hν ≃ 700 eV. An also circularly polarized, highly intense UV laser pulse with hν ≃ 3.1 eV was temporally and spatially overlapped, causing the photoelectrons to redistribute into so-called sidebands that are energetically separated by the photon energy of the UV laser. By determining the circular dichroism of these redistributed electrons using angle resolving electron spectroscopy and modeling the results with the strong-field approximation, this scheme allows to unambiguously determine the absolute degree of circular polarization of any pulsed, ultraintense XUV or X-ray laser source.

  10. Capacity of X-ray fluorescence analysis

    International Nuclear Information System (INIS)

    Wobrauschek, P.; Kregsamer, P.

    1997-01-01

    X-Ray fluorescence analysis (XRF) is a powerful analytical tool for the qualitative and quantitative determination of chemical elements in a sample. Two different detection principles are accepted widely: wavelength dispersive and energy dispersive. Various sources for XRF are discussed: X-ray tubes, accelerators for particle induced XRF, radioactive isotopes, and the use of synchrotron radiation. Applications include environmental, technical, medical, fine art, and forensic studies. Due to the demands of research and application special techniques like total reflection XRF (TXRF) were developed with ultimately achievable detection limits in the femtogram region. The elements detectable by XRF range from Be to U. (author)

  11. X-ray microbeams based on Kumakhov polycapillary optics and its ...

    Indian Academy of Sciences (India)

    because of the total external reflection of X-rays from the inner capillary walls .... of the area of apertures and walls, and losses on internal reflections. All these factors as a whole are considered in experimentally received transmission factor Tr.

  12. Use of total-reflection x-ray fluorescence in search of a biomonitor for environmental pollution in Vietnam

    International Nuclear Information System (INIS)

    Boman, J.; Wagner, A.; Brauer, H.; Viet Binh, D.

    2000-01-01

    The concentration of trace elements in tissues of several animals collected in the Ha Nam province, about 25 km south of Hanoi, Vietnam, has been investigated using total-reflection x-ray fluorescence (TXRF). With this study we wanted to address whether any of the animals were possible candidates for being bio-monitors for the pollution situation in a selected area of Vietnam. We also aim to compare the measured trace element concentrations to those representative to other provinces in Vietnam as well as to other parts of the world. An extensive bio-diversity of animals exists in Vietnam, where many of them play an important economic role in the agricultural breeding and production. The accumulation process of trace elements is still not known for a large number of animals. The parts of the collected animals chosen for analysis were muscle tissue and liver. The specimens were dried under vacuum and kept frozen. Before the TXRF analysis, the solid and dried samples were digested in nitric acid. The analysis was made at the Department of Physics at Chalmers University of Technology and Goeteborg University, Sweden, where a TXRF spectrometer has been developed by the Environmental Physics group. The results show that there could be a large variation in the concentration of trace elements, not only between the different animals but also between tissue parts of the same animal. Obviously, when selecting an organism to be used as a bio-monitor, other factors than the mere concentration of trace elements must be considered. (author)

  13. Wide field x-ray telescopes: Detecting x-ray transients/afterglows related to GRBs

    International Nuclear Information System (INIS)

    Hudec, Rene; Pina, Ladislav; Inneman, Adolf; Gorenstein, Paul

    1998-01-01

    The recent discovery of X-ray afterglows of GRBs opens the possibility of analyses of GRBs by their X-ray detections. However, imaging X-ray telescopes in current use mostly have limited fields of view. Alternative X-ray optics geometries achieving very large fields of view have been theoretically suggested in the 70's but not constructed and used so far. We review the geometries and basic properties of the wide-field X-ray optical systems based on one- and two-dimensional lobster-eye geometry and suggest technologies for their development and construction. First results of the development of double replicated X-ray reflecting flats for use in one-dimensional X-ray optics of lobster-eye type are presented and discussed. The optimum strategy for locating GRBs upon their X-ray counterparts is also presented and discussed

  14. Determination of wafer bonding mechanisms for plasma activated SiN films with x-ray reflectivity

    Energy Technology Data Exchange (ETDEWEB)

    Hayashi, S [Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095 (United States); Sandhu, R [Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095 (United States); Wojtowicz, M [Northrop Grumman Space Technology, Redondo Beach, CA 90278 (United States); Sun, Y [Department of Chemical Engineering, University of California, Los Angeles, CA 90095 (United States); Hicks, R [Department of Chemical Engineering, University of California, Los Angeles, CA 90095 (United States); Goorsky, M S [Department of Materials Science and Engineering, University of California, Los Angeles, CA 90095 (United States)

    2005-05-21

    Specular and diffuse x-ray reflectivity measurements were employed for wafer bonding studies of surface and interfacial reactions in {approx}800 A thick SiN films deposited on III-V substrates. CuK{sub {alpha}}{sub 1} radiation was employed for these measurements. The as-deposited films show very low surface roughness and uniform, high density SiN. Reflectivity measurements show that an oxygen plasma treatment converts the nitride surface to a somewhat porous SiO{sub x} layer (67 A thick, at 80% of SiO{sub 2} density), with confirmation of the oxide formation from x-ray photoelectron spectroscopy. Reactions at the bonded interface of two oxygen plasma treated SiN layers were examined using a bonded structure from which one of the III-V wafers is removed. Reflectivity measurements of bonded structures annealed at 150 deg. C and 300 deg. C show an increase in the SiO{sub x} layer density and thickness and even a density gradient across this interface. The increase in density is correlated with an increase in bond strength, where after the 300 deg. C anneal, a high interfacial bond strength, exceeding the bulk strength, was achieved.

  15. Radiation doses for X-ray diagnosis teeth in dental medicine

    International Nuclear Information System (INIS)

    Direkov, Lyubomir

    2009-01-01

    X-rays are the first ionizing radiation, which are applied in medicine for diagnostic radiology and X-ray therapy. While in the beginning they are mainly used for X-ray photos of the chest /lungs and in severe fractures of the limbs, then in recent years they are widely applied in diagnostics of teeth in dental medicine. Considering that caries is a widespread disease, both in children and adults, and it requires repeated x-ray photographs of the damaged teeth for the individual, the total radiation doses, which reflect on people from the X-rays are at high values. In order to reduce external exposure to other organs /mainly thyroid gland/ by X-ray pictures of teeth, it should be used with special lead aprons with large coefficient of reduction. Keywords: doses of radiation, X-ray machines, dental, x-ray pictures of teeth, protection sources

  16. X-ray reflectivity of cobalt and titanium in the vicinity of the Lsub(2,3) absorption edges

    International Nuclear Information System (INIS)

    Bremer, J.; Kaihola, L.; Keski-Kuha, R.

    1980-01-01

    X-ray reflectivity across cobalt and titanium Lsub(2,3) absorption edges was measured as a function of energy by means of continuous radiation from a tungsten anode in a grating spectrometer. The real and imaginary parts of the refractive index were obtained from the absorption curves and an exact Kramers-Kronig analysis. A measured fine structure in the reflected intensities was interpreted as an effect of white lines in the absorption spectra. The x-ray intensity was calculated as a function of energy by means of the Fresnel formula. (author)

  17. Evaluation of growth tree rings of Tipuana Tipu as biomonitoring of environmental pollution by synchrotron radiation total reflection X-ray fluorescence

    International Nuclear Information System (INIS)

    Moreira, Silvana; Geraldo, Simoni Michetti; Canteras, Felippe Benavente

    2013-01-01

    The bioindicators, plants or animals capable to present qualitative and/or quantitative answers, when exposed to pollutant substances. Trees record and incorporate in their log, developed year after year, the impressions of the environment, becoming possible the study of the different environmental changes, including contamination, that have occurred over the life of these trees. The selected species, Tipuana Tipu, of the Leguminosae family, is native of Argentina and Bolivia and was introduced in Brazil as an ornamental plant. It is one of the most common trees in the urban landscaping in Sao Paulo city. The present project has as main objective the determination of the content of potentially toxic elements in samples of growth the tree rings of Tipuana Tipu, previously dated, collected in strategically locations of Sao Paulo, using Synchrotron Radiation Total Reflection X-Ray Fluorescence. Samples were also collected in the Piracicaba (SP), local of little access and small flow traffic. The SR-TXRF analysis was carried out in the X-ray Fluorescence Beamline at the Brazilian Synchrotron Light Source Laboratory, located in Campinas city, Sao Paulo State, Brazil. Some trace elements present concentrations higher than considered as normal in some periods. In this paper the highest value for Pb was 123.54 μg.g -1 considered as threshold value was observed for the period 1998 to 2000 for University of Sao Paulo, Butanta site. For the same period excessive level was also observed for samples collected in Piracicaba city. In Sao Paulo city, sample collected in the campus of University of Sao Paulo (Butanta), showed the highest toxicity, with concentration above the tolerable limit for Ti, Cr and Cu. For the samples collected in Piracicaba city the concentrations of Cr, Ni, Cu, and Pb exceeding the toxicity limits. (author)

  18. Evaluation of growth tree rings of Tipuana Tipu as biomonitoring of environmental pollution by synchrotron radiation total reflection X-ray fluorescence

    Energy Technology Data Exchange (ETDEWEB)

    Moreira, Silvana; Geraldo, Simoni Michetti; Canteras, Felippe Benavente, E-mail: silvana@fec.unicamp.br, E-mail: felippe.canteras@gmail.com [Universidade Estadual de Campinas (FEC/UNICAMP), Campinas, SP (Brazil). Dept. de Saneamento e Ambiente

    2013-07-01

    The bioindicators, plants or animals capable to present qualitative and/or quantitative answers, when exposed to pollutant substances. Trees record and incorporate in their log, developed year after year, the impressions of the environment, becoming possible the study of the different environmental changes, including contamination, that have occurred over the life of these trees. The selected species, Tipuana Tipu, of the Leguminosae family, is native of Argentina and Bolivia and was introduced in Brazil as an ornamental plant. It is one of the most common trees in the urban landscaping in Sao Paulo city. The present project has as main objective the determination of the content of potentially toxic elements in samples of growth the tree rings of Tipuana Tipu, previously dated, collected in strategically locations of Sao Paulo, using Synchrotron Radiation Total Reflection X-Ray Fluorescence. Samples were also collected in the Piracicaba (SP), local of little access and small flow traffic. The SR-TXRF analysis was carried out in the X-ray Fluorescence Beamline at the Brazilian Synchrotron Light Source Laboratory, located in Campinas city, Sao Paulo State, Brazil. Some trace elements present concentrations higher than considered as normal in some periods. In this paper the highest value for Pb was 123.54 μg.g{sup -1} considered as threshold value was observed for the period 1998 to 2000 for University of Sao Paulo, Butanta site. For the same period excessive level was also observed for samples collected in Piracicaba city. In Sao Paulo city, sample collected in the campus of University of Sao Paulo (Butanta), showed the highest toxicity, with concentration above the tolerable limit for Ti, Cr and Cu. For the samples collected in Piracicaba city the concentrations of Cr, Ni, Cu, and Pb exceeding the toxicity limits. (author)

  19. Radiative electron rearrangement and polarization in target K x-ray spectra

    International Nuclear Information System (INIS)

    Jamison, K.A.

    1978-01-01

    Two topics in the atomic physics of ion-atom collisions are studied. The first is an investigation of a free-atom decay process that is shown to be a two-electron one-photon decay. This two-electron decay requires an initial state with multiple inner-shell vacancies that has a high probability of creation in ion-atom collisions. Because this decay promotes one electron to a higher shell while allowing the other to fall to a lower shell, it is referred to as radiative electron rearrangement (RER). The investigation of this process includes the experimental study of the x-ray spectra region approx. 150 eV below the characteristic Kα 1 2 target radiation in third period elements when bombarded by various ion beams in the energy range 1 to 2 MeV/amu. Theoretical calculations of the transition energies, line strengths, and line widths are performed to verify the origin of the RER lines. The second topic of consideration is the study of the polarization of Kα satellite radiation from targets of Al and Si. It is shown that the polarization, which is observed experimentally with a curved-crystal polarimeter, is due to the nonstatistical population of the magnetic substates created in specific ion-atom collisions. Further, the polarization of the RER lines is studied. The connection between the polarization of the normal Kα satellite radiation and the polarization of the RER lines adds final proof to their origin as two-electron one-photon transitions

  20. Total reflection X-ray fluorescence analysis of oral fluids of women affected by osteoporosis and osteopenia

    Science.gov (United States)

    Sánchez, Héctor Jorge; Valentinuzzi, María Cecilia; Grenón, Miram; Abraham, José

    2008-12-01

    Osteoporosis is a disease characterized by low bone mass and microarchitectural deterioration of bone tissue, leading to bone fragility and an increased susceptibility to fractures; the early stage of decreased bone density is called osteopenia. More than 200 million people are affected and about 50% of post-menopausic women are expected to develop the disease. Osteoporosis, osteopenia and periodontal disease have in common several risk factors, being hyperthyroidism and smoking habits the most important ones. There is scarce information in the literature about the association between periodontal disease and osteoporosis and/or osteopenia. Some works suggest that osteoporotic women are susceptible to a higher loss of periodontal insertion, alveolar bones, and teeth. Thirty adult post-menopausic women were studied; some of them were healthy (control group) and the rest of them were undergoing some stage of osteoporosis or osteopenia. All the subjects were healthy, non-smokers, not having dental implants, and with communitarian periodontal index higher than 1(CPI > 1). Samples of saliva and gingival crevice fluid were extracted with calibrated micro-capillaries and deposited on Si reflectors. Known amounts of Ga were added to the samples in order to act as internal standard for quantification by the total reflection x-ray fluorescence technique. Experimental concentrations of several elements (P, S, Cl, K, Ca, Cr, Fe, NI, Cu, and Zn) were determined. The concentration of some elements in saliva showed different behavior as compared to gingival crevice fluid. Some critical elements of bone composition, such as Ca and Zn, present very distinguishable behavior. Improvements in the statistics are required for a better assessment of a routine method and to establish some correlation with periodontal disease. TXRF seems to be a promising method to evaluate the evolution of osteoporosis.

  1. Total reflection X-ray fluorescence analysis of oral fluids of women affected by osteoporosis and osteopenia

    International Nuclear Information System (INIS)

    Sanchez, Hector Jorge; Valentinuzzi, Maria Cecilia; Grenon, Miram; Abraham, Jose

    2008-01-01

    Osteoporosis is a disease characterized by low bone mass and microarchitectural deterioration of bone tissue, leading to bone fragility and an increased susceptibility to fractures; the early stage of decreased bone density is called osteopenia. More than 200 million people are affected and about 50% of post-menopausic women are expected to develop the disease. Osteoporosis, osteopenia and periodontal disease have in common several risk factors, being hyperthyroidism and smoking habits the most important ones. There is scarce information in the literature about the association between periodontal disease and osteoporosis and/or osteopenia. Some works suggest that osteoporotic women are susceptible to a higher loss of periodontal insertion, alveolar bones, and teeth. Thirty adult post-menopausic women were studied; some of them were healthy (control group) and the rest of them were undergoing some stage of osteoporosis or osteopenia. All the subjects were healthy, non-smokers, not having dental implants, and with communitarian periodontal index higher than 1(CPI > 1). Samples of saliva and gingival crevice fluid were extracted with calibrated micro-capillaries and deposited on Si reflectors. Known amounts of Ga were added to the samples in order to act as internal standard for quantification by the total reflection x-ray fluorescence technique. Experimental concentrations of several elements (P, S, Cl, K, Ca, Cr, Fe, NI, Cu, and Zn) were determined. The concentration of some elements in saliva showed different behavior as compared to gingival crevice fluid. Some critical elements of bone composition, such as Ca and Zn, present very distinguishable behavior. Improvements in the statistics are required for a better assessment of a routine method and to establish some correlation with periodontal disease. TXRF seems to be a promising method to evaluate the evolution of osteoporosis

  2. Total reflection X-ray fluorescence analysis of oral fluids of women affected by osteoporosis and osteopenia

    Energy Technology Data Exchange (ETDEWEB)

    Sanchez, Hector Jorge [Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina)], E-mail: jsan@famaf.unc.edu.ar; Valentinuzzi, Maria Cecilia [Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina); Grenon, Miram [Facultad de Odontologia, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina); Abraham, Jose [Facultad de Matematica Astronomia y Fisica, Universidad Nacional de Cordoba, 5000 Cordoba (Argentina)

    2008-12-15

    Osteoporosis is a disease characterized by low bone mass and microarchitectural deterioration of bone tissue, leading to bone fragility and an increased susceptibility to fractures; the early stage of decreased bone density is called osteopenia. More than 200 million people are affected and about 50% of post-menopausic women are expected to develop the disease. Osteoporosis, osteopenia and periodontal disease have in common several risk factors, being hyperthyroidism and smoking habits the most important ones. There is scarce information in the literature about the association between periodontal disease and osteoporosis and/or osteopenia. Some works suggest that osteoporotic women are susceptible to a higher loss of periodontal insertion, alveolar bones, and teeth. Thirty adult post-menopausic women were studied; some of them were healthy (control group) and the rest of them were undergoing some stage of osteoporosis or osteopenia. All the subjects were healthy, non-smokers, not having dental implants, and with communitarian periodontal index higher than 1(CPI > 1). Samples of saliva and gingival crevice fluid were extracted with calibrated micro-capillaries and deposited on Si reflectors. Known amounts of Ga were added to the samples in order to act as internal standard for quantification by the total reflection x-ray fluorescence technique. Experimental concentrations of several elements (P, S, Cl, K, Ca, Cr, Fe, NI, Cu, and Zn) were determined. The concentration of some elements in saliva showed different behavior as compared to gingival crevice fluid. Some critical elements of bone composition, such as Ca and Zn, present very distinguishable behavior. Improvements in the statistics are required for a better assessment of a routine method and to establish some correlation with periodontal disease. TXRF seems to be a promising method to evaluate the evolution of osteoporosis.

  3. Accretion dynamics and polarized X-ray emission of magnetized neutron stars

    Science.gov (United States)

    Arons, Jonathan

    1991-01-01

    The basic ideas of accretion onto magnetized neutron stars are outlined. These are applied to a simple model of the structure of the plasma mound sitting at the magnetic poles of such a star, in which upward diffusion of photons is balanced by their downward advection. This steady flow model of the plasma's dynamical state is used to compute the emission of polarized X-raysfrom the optically thick, birefringent medium. The linear polarization of the continuum radiation emerging from the quasi-static mound is found to be as much as 40 percent at some rotation phases, but is insensitive to the geometry of the accretion flow. The role of the accretion shock, whose detailed polarimetric and spectral characteristics have yet to be calculated, is emphasized as the final determinant of the properties of the emerging X-rays. Some results describing the fully time dependent dynamics of the flow are also presented. In particular, steady flow onto a neutron star is shown to exhibit formation of 'photon bubbles', regions of greatly reduced plasma density filled with radiation which form and rise on millisecond time scale. The possible role of these complex structures in the flow for the formation of the emergent spectrum is briefly outlined.

  4. Fullerene films and fullerene-dodecylamine adduct monolayers at air-water interfaces studied by neutron and x-ray reflection

    DEFF Research Database (Denmark)

    Wang, J.Y.; Vaknin, D.; Uphaus, R.A.

    1994-01-01

    Neutron and X-ray reflection measurements and surface pressure isotherms of spread films of the fullerene-dodecylamine adduct C60-[NH2(CH2)11CH3]x all indicate that this material may form monomolecular layers on water surfaces. The reflection data sets (neutron on both H2O and D2O) can be accounted...... for by a single model structure defined in terms of the dimensions of an average cell and its chemical composition. This model ascribes a total thickness of about 29 angstrom to the molecular interface layer with the following internal structure. The fullerenes (with several alkyl chains attached) form a central...... stratum and the remainder alkyl tails are located close to both the air and the water interfaces. The alkyl moieties close to the aqueous substrate are hydrated. The reflection experiments and the isotherms suggest that on average 8 +/- 3 dodecylamine molecules are present per fullerene, consistent within...

  5. X-ray diffraction and imaging with a coherent beam: application to X-ray optical elements and to crystals exhibiting phase inhomogeneities

    International Nuclear Information System (INIS)

    Masiello, F.

    2011-05-01

    The exceptional properties of synchrotron light sources have been exploited in very different disciplines, from archaeology to chemistry, from material science to biology, from medicine to physics. Among these properties it is important to mention the high brilliance, continuum spectrum, high degree of polarization, time structure, small source size and divergence of the beam, the last resulting in a high transversal coherence of the produced radiation. This high transversal coherence of the synchrotron sources has permitted the development of new techniques, e.g. phase contrast imaging, X-ray photon correlation spectroscopy and coherent X-ray diffraction imaging (CXDI). This thesis work will consist essentially of three parts. In the first part it will be presented the work done as a member of the X-ray Optics Group of ESRF in the characterization of high quality diamond crystals foreseen as X-ray optical elements. The characterization has been done using different complementary X-ray techniques, such as high resolution diffraction, topography, grazing incidence diffraction, reflectivity and measurements of the coherence preservation using the Talbot effect. In the second part, I will show the result obtained in the study of the temperature behaviours of the domain in periodically poled ferroelectrics crystals. This type of measurements, based on Bragg-Fresnel diffraction, are possible only thanks to the high degree of coherence of the beam. In the third part, I will present the results obtained in the characterization of diamonds foreseen for applications other than X-ray optical elements. (author)

  6. Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer

    Energy Technology Data Exchange (ETDEWEB)

    Bixler, J.V.; Craig, W.; Decker, T. [Lawrence Livermore National Lab., CA (United States); Aarts, H.; Boggende, T. den; Brinkman, A.C. [Space Research Organization Netherlands, Utrecht (Netherlands); Burkert, W.; Brauninger, H. [Max-Planck Institute fur Extraterrestische Physik, Testanlage (Germany); Branduardi-Raymont, G. [Univ. College London (United Kingdom); Dubbeldam, L. [Space Research Organization Netherlands, Leiden (Netherlands)] [and others

    1994-07-12

    X-ray calibration of the Electro-Optical Breadboard Model (EOBB) of the XXM Reflection Grating Spectrometer has been carried out at the Panter test facility in Germany. The EOBB prototype optics consisted of a four-shell grazing incidence mirror module followed by an array of eight reflection gratings. The dispersed x-rays were detected by an array of three CCDs. Line profile and efficiency measurements where made at several energies, orders, and geometric configurations for individual gratings and for the grating array as a whole. The x-ray measurements verified that the grating mounting method would meet the stringent tolerances necessary for the flight instrument. Post EOBB metrology of the individual gratings and their mountings confirmed the precision of the grating boxes fabrication. Examination of the individual grating surface`s at micron resolution revealed the cause of anomalously wide line profiles to be scattering due to the crazing of the replica`s surface.

  7. Testing the Performance and Accuracy of the RELXILL Model for the Relativistic X-Ray Reflection from Accretion Disks

    Science.gov (United States)

    Choudhury, Kishalay; García, Javier A.; Steiner, James F.; Bambi, Cosimo

    2017-12-01

    The reflection spectroscopic model RELXILL is commonly implemented in studying relativistic X-ray reflection from accretion disks around black holes. We present a systematic study of the model’s capability to constrain the dimensionless spin and ionization parameters from ∼6000 Nuclear Spectroscopic Telescope Array (NuSTAR) simulations of a bright X-ray source employing the lamp-post geometry. We employ high-count spectra to show the limitations in the model without being confused with limitations in signal-to-noise. We find that both parameters are well-recovered at 90% confidence with improving constraints at higher reflection fraction, high spin, and low source height. We test spectra across a broad range—first at 106–107 and then ∼105 total source counts across the effective 3–79 keV band of NuSTAR, and discover a strong dependence of the results on how fits are performed around the starting parameters, owing to the complexity of the model itself. A blind fit chosen over an approach that carries some estimates of the actual parameter values can lead to significantly worse recovery of model parameters. We further stress the importance to span the space of nonlinear-behaving parameters like {log} ξ carefully and thoroughly for the model to avoid misleading results. In light of selecting fitting procedures, we recall the necessity to pay attention to the choice of data binning and fit statistics used to test the goodness of fit by demonstrating the effect on the photon index Γ. We re-emphasize and implore the need to account for the detector resolution while binning X-ray data and using Poisson fit statistics instead while analyzing Poissonian data.

  8. Charge collection and absorption-limited x-ray sensitivity of pixellated x-ray detectors

    International Nuclear Information System (INIS)

    Kabir, M. Zahangir; Kasap, S.O.

    2004-01-01

    The charge collection and absorption-limited x-ray sensitivity of a direct conversion pixellated x-ray detector operating in the presence of deep trapping of charge carriers is calculated using the Shockley-Ramo theorem and the weighting potential of the individual pixel. The sensitivity of a pixellated x-ray detector is analyzed in terms of normalized parameters; (a) the normalized x-ray absorption depth (absorption depth/photoconductor thickness), (b) normalized pixel width (pixel size/thickness), and (c) normalized carrier schubwegs (schubweg/thickness). The charge collection and absorption-limited sensitivity of pixellated x-ray detectors mainly depends on the transport properties (mobility and lifetime) of the charges that move towards the pixel electrodes and the extent of dependence increases with decreasing normalized pixel width. The x-ray sensitivity of smaller pixels may be higher or lower than that of larger pixels depending on the rate of electron and hole trapping and the bias polarity. The sensitivity of pixellated detectors can be improved by ensuring that the carrier with the higher mobility-lifetime product is drifted towards the pixel electrodes

  9. In vivo x-ray fluorescence of lead and other toxic trace elements

    International Nuclear Information System (INIS)

    Chettle, D.R.

    1995-01-01

    The first in vivo x-ray fluorescence measurements of lead in bone used y-rays from a 57 Co source to excite Pb K x-rays. Later systems used γ-rays from 109 Cd to excite Pb K x-rays or polarized x-rays to excite Ph L x-rays. All three approaches involve an extremely low effective dose to the subject. Of the two K x-ray techniques, 109 Cd is more precise and more flexible in choice of measurement site. Pb L x-ray fluorescence (L-XRF) effectively samples lead at bone surfaces, whereas Ph K x-ray fluorescence (K-XRF) samples through the bulk of a bone. Both the polarized L-XRF and 109 Cd K-XRF achieve similar precision. Renal mercury has recently been determined using a polarized x-ray source, Both renal and hepatic cadmium can be measured using polarized x-rays in conjunction with a Si(Li) detector. Platinum and gold have been measured both by radioisotopic source excitation and by using polarized x-rays, but the latter is to be preferred. Applications of Pb K-XRF have shown that measured bone lead relates strongly to cumulative lead exposure. Secondly, biological half lives of lead in different bone types have been estimated from limited longitudinal data sets and from some cross sectional surveys. Thirdly, the effect of bone lead as an endogenous source of lead has been demonstrated and it has been shown that a majority of circulating blood lead can be mobilized from bone, rather than deriving from new exposure, in some retired lead workers. 35 refs., 5 tabs

  10. A mirror for lab-based quasi-monochromatic parallel x-rays.

    Science.gov (United States)

    Nguyen, Thanhhai; Lu, Xun; Lee, Chang Jun; Jung, Jin-Ho; Jin, Gye-Hwan; Kim, Sung Youb; Jeon, Insu

    2014-09-01

    A multilayered parabolic mirror with six W/Al bilayers was designed and fabricated to generate monochromatic parallel x-rays using a lab-based x-ray source. Using this mirror, curved bright bands were obtained in x-ray images as reflected x-rays. The parallelism of the reflected x-rays was investigated using the shape of the bands. The intensity and monochromatic characteristics of the reflected x-rays were evaluated through measurements of the x-ray spectra in the band. High intensity, nearly monochromatic, and parallel x-rays, which can be used for high resolution x-ray microscopes and local radiation therapy systems, were obtained.

  11. Application of energy dispersive x-ray techniques for water analysis

    International Nuclear Information System (INIS)

    Funtua, I. I.

    2000-07-01

    Energy dispersive x-ray fluorescence (EDXRF) is a class of emission spectroscopic techniques that depends upon the emission of characteristic x-rays following excitation of the atomic electron energy levels by tube or isotopic source x-rays. The technique has found wide range of applications that include determination of chemical elements of water and water pollutants. Three EDXRF systems, the isotopic source, secondary target and total reflection (TXRF) are available at the Centre for Energy research and Training. These systems have been applied for the analysis of sediments, suspensions, ground water, river and rainwater. The isotopic source is based on 55 Fe, 109 Cd and 241 Am excitations while the secondary target and the total reflection are utilizing a Mo x-ray tube. Sample preparation requirements for water analysis range from physical and chemical pre-concentration steps to direct analysis and elements from Al to U can be determined with these systems. The EDXRF techniques, TXRF in particular with its multielement capability, low detection limit and possibility of direct analysis for water have competitive edge over the traditional methods of atomic absorption and flame photometry

  12. Reflection of femtosecond pulses from soft X-ray free-electron laser by periodical multilayers

    Energy Technology Data Exchange (ETDEWEB)

    Ksenzov, D.; Grigorian, S.; Pietsch, U. [Faculty of Physics, University of Siegen (Germany); Hendel, S.; Bienert, F.; Sacher, M.D.; Heinzmann, U. [Faculty of Physics, University of Bielefeld (Germany)

    2009-08-15

    Recent experiments on a soft X-ray free-electron laser (FEL) source (FLASH in Hamburg) have shown that multilayers (MLs) can be used as optical elements for highly intense X-ray irradiation. An effort to find most appropriate MLs has to consider the femtosecond time structure and the particular photon energy of the FEL. In this paper we have analysed the time response of 'low absorbing' MLs (e.g. such as La/B{sub 4}C) as a function of the number of periods. Interaction of a pulse train of Gaussian shaped sub-pulses using a realistic ML grown by electron-beam evaporation technique has been analysed in the soft-X-ray range. The structural parameters of the MLs were obtained by reflectivity measurements at BESSY II and subsequent profile fittings. (Abstract Copyright [2009], Wiley Periodicals, Inc.)

  13. Polarization ray tracing in anisotropic optically active media. I. Algorithms

    International Nuclear Information System (INIS)

    McClain, S.C.; Hillman, L.W.; Chipman, R.A.

    1993-01-01

    Procedures for performing polarization ray tracing through birefringent media are presented in a form compatible with the standard methods of geometrical ray tracing. The birefringent materials treated include the following: anisotropic optically active materials such as quartz, non-optically active uniaxial materials such as calcite, and isotropic optically active materials such as mercury sulfide and organic liquids. Refraction and reflection algorithms are presented that compute both ray directions and wave directions. Methods for computing polarization modes, refractive indices, optical path lengths, and Fresnel transmission and reflection coefficients are also specified. A numerical example of these algorithms is given for analyzing the field of view of a quartz rotator. 37 refs., 3 figs

  14. Prospects for supermirrors in hard x-ray spectroscopy

    DEFF Research Database (Denmark)

    Joensen, Karsten D.; Gorenstein, Paul; Christensen, Finn Erland

    1994-01-01

    . The measured x-ray reflectivities are well accounted for by the standard dynamical theories of multilayer reflection. Hard x ray applications that could benefit from x-ray supermirror coatings include focusing and imaging instrumentation for astrophysics, collimating and focusing devices for synchrotron...

  15. Center for X-ray Optics, 1988

    International Nuclear Information System (INIS)

    1989-04-01

    This report briefly reviews the following topics: soft-x-ray imaging; reflective optics for hard x-rays; coherent XUV sources; spectroscopy with x-rays; detectors for coronary artery imaging; synchrotron-radiation optics; and support for the advanced light source

  16. Polarization reversal and ferroelectric domain structure observed in electroded cesium dihydrogen phosphate crystals using an X-ray anomalous dispersion effect

    International Nuclear Information System (INIS)

    Ozaki, Toru; Amau, Toshirou; Kawata, Hiroshi; Mizuno, Kaoru; Mori, Koichi.

    1997-01-01

    We have carried out an X-ray intensity measurement and X-ray topography on electroded b plates of ferroelectric cesium dihydrogen phosphate, CsH 2 PO 4 (CDP), using a synchrotron radiation with a wavelength of 2.482 A above the Cs L 3 -absorption edge. We have found that integrated intensities I(150) and I(1-bar5-bar0) show an anomalously large breakdown of Friedel's law, I(150)/I(1-bar5-bar0)=10.4 at 125 K, and display a ferroelectric hysteresis loop. The hysteresis loop determines that spontaneous polarization is antiparallel to the b axes set in both ferroelectric crystal structures related by inversions. The (150) diffraction topography shows that a single domain turns into a lamellar domain structure without fractal aspects after short-circuiting the b plate. The atomic displacement associated with polarization reversal is shown in a crystal structure model of 180deg domains observed in the X-ray topography. (author)

  17. The influence of x-ray energy on lung dose uniformity in total-body irradiation

    International Nuclear Information System (INIS)

    Ekstrand, Kenneth; Greven, Kathryn; Wu Qingrong

    1997-01-01

    Purpose: In this study we examine the influence of x-ray energy on the uniformity of the dose within the lung in total-body irradiation treatments in which partial transmission blocks are used to control the lung dose. Methods and Materials: A solid water phantom with a cork insert to simulate a lung was irradiated by x-rays with energies of either 6, 10, or 18 MV. The source to phantom distance was 3.9 meters. The cork insert was either 10 cm wide or 6 cm wide. Partial transmission blocks with transmission factors of 50% were placed anterior to the cork insert. The blocks were either 8 or 4 cm in width. Kodak XV-2 film was placed in the midline of the phantom to record the dose. Midplane dose profiles were measured with a densitometer. Results: For the 10 cm wide cork insert the uniformity of the dose over 80% of the block width varied from 6.6% for the 6 MV x-rays to 12.2% for the 18 MV x-rays. For the 6 cm wide cork insert the uniformity was comparable for all three x-ray energies, but for 18 MV the central dose increased by 9.4% compared to the 10 cm wide insert. Conclusion: Many factors must be considered in optimizing the dose for total-body irradiation. This study suggests that for AP/PA techniques lung dose uniformity is superior with 6 MV irradiation. The blanket recommendation that the highest x-ray energy be used in TBI is not valid for all situations

  18. Development of Total Reflection X-ray fluorescence spectrometry quantitative methodologies for elemental characterization of building materials and their degradation products

    Science.gov (United States)

    García-Florentino, Cristina; Maguregui, Maite; Marguí, Eva; Torrent, Laura; Queralt, Ignasi; Madariaga, Juan Manuel

    2018-05-01

    In this work, a Total Reflection X-ray fluorescence (TXRF) spectrometry based quantitative methodology for elemental characterization of liquid extracts and solids belonging to old building materials and their degradation products from a building of the beginning of 20th century with a high historic cultural value in Getxo, (Basque Country, North of Spain) is proposed. This quantification strategy can be considered a faster methodology comparing to traditional Energy or Wavelength Dispersive X-ray fluorescence (ED-XRF and WD-XRF) spectrometry based methodologies or other techniques such as Inductively Coupled Plasma Mass Spectrometry (ICP-MS). In particular, two kinds of liquid extracts were analysed: (i) water soluble extracts from different mortars and (ii) acid extracts from mortars, black crusts, and calcium carbonate formations. In order to try to avoid the acid extraction step of the materials and their degradation products, it was also studied the TXRF direct measurement of the powdered solid suspensions in water. With this aim, different parameters such as the deposition volume and the measuring time were studied for each kind of samples. Depending on the quantified element, the limits of detection achieved with the TXRF quantitative methodologies for liquid extracts and solids were set around 0.01-1.2 and 2-200 mg/L respectively. The quantification of K, Ca, Ti, Mn, Fe, Zn, Rb, Sr, Sn and Pb in the liquid extracts was proved to be a faster alternative to other more classic quantification techniques (i.e. ICP-MS), accurate enough to obtain information about the composition of the acidic soluble part of the materials and their degradation products. Regarding the solid samples measured as suspensions, it was quite difficult to obtain stable and repetitive suspensions affecting in this way the accuracy of the results. To cope with this problem, correction factors based on the quantitative results obtained using ED-XRF were calculated to improve the accuracy of

  19. X-Ray Spectro-Polarimetry with Photoelectric Polarimeters

    Science.gov (United States)

    Strohmayer, T. E.

    2017-01-01

    We derive a generalization of forward fitting for X-ray spectroscopy to include linear polarization of X-ray sources, appropriate for the anticipated next generation of space-based photoelectric polarimeters. We show that the inclusion of polarization sensitivity requires joint fitting to three observed spectra, one for each of the Stokes parameters, I(E), U(E), and Q(E). The equations for StokesI (E) (the total intensity spectrum) are identical to the familiar case with no polarization sensitivity, and for which the model-predicted spectrum is obtained by a convolution of the source spectrum, F (E), with the familiar energy response function,(E) R(E,E), where (E) and R(E,E) are the effective area and energy redistribution matrix, respectively. In addition to the energy spectrum, the two new relations for U(E) and Q(E) include the source polarization fraction and position angle versus energy, a(E), and 0(E), respectively, and the model-predicted spectra for these relations are obtained by a convolution with the modulated energy response function, (E)(E) R(E,E), where(E) is the energy-dependent modulation fraction that quantifies a polarimeters angular response to 100 polarized radiation. We present results of simulations with response parameters appropriate for the proposed PRAXyS Small Explorer observatory to illustrate the procedures and methods, and we discuss some aspects of photoelectric polarimeters with relevance to understanding their calibration and operation.

  20. Magnetic x-ray microdiffraction

    Energy Technology Data Exchange (ETDEWEB)

    Evans, Paul G [Computer-Aided Engineering Center, University of Wisconsin, Madison, WI 53706 (United States); Isaacs, Eric D [Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 (United States)

    2006-08-07

    Magnetic x-ray microdiffraction uses the structural specificity of x-ray diffraction to probe complex magnetic structures at the length scales relevant to physical phenomena including domain dynamics and phase transitions. Conventional magnetic crystallography techniques such as neutron or x-ray diffraction lack this spatial resolution. The combination of both reciprocal space and real space resolution with a rich magnetic cross section allows new microscopy techniques to be developed and applied to magnetism at the scale of single domains. Potential applications include a wide range of magnetic problems in nanomagnetism, the interaction of strain, polarization and magnetization in complex oxides and spatially resolved studies of magnetic phase transitions. We present the physical basis for x-ray microdiffraction and magnetic scattering processes, review microdiffraction domain imaging techniques in antiferromagnetic and ferromagnetic materials and discuss potential directions for studies. (topical review)

  1. 3D Cloud Radiative Effects on Polarized Reflectances

    Science.gov (United States)

    Cornet, C.; Matar, C.; C-Labonnote, L.; Szczap, F.; Waquet, F.; Parol, F.; Riedi, J.

    2017-12-01

    As recognized in the last IPCC report, clouds have a major importance in the climate budget and need to be better characterized. Remote sensing observations are a way to obtain either global observations of cloud from satellites or a very fine description of clouds from airborne measurements. An increasing numbers of radiometers plan to measure polarized reflectances in addition to total reflectances, since this information is very helpful to obtain aerosol or cloud properties. In a near future, for example, the Multi-viewing, Multi-channel, Multi-polarization Imager (3MI) will be part the EPS-SG Eumetsat-ESA mission. It will achieve multi-angular polarimetric measurements from visible to shortwave infrared wavelengths. An airborne prototype, OSIRIS (Observing System Including Polarization in the Solar Infrared Spectrum), is also presently developed at the Laboratoire d'Optique Atmospherique and had already participated to several measurements campaigns. In order to analyze suitably the measured signal, it it necessary to have realistic and accurate models able to simulate polarized reflectances. The 3DCLOUD model (Szczap et al., 2014) was used to generate three-dimensional synthetic cloud and the 3D radiative transfer model, 3DMCPOL (Cornet et al., 2010) to compute realistic polarized reflectances. From these simulations, we investigate the effects of 3D cloud structures and heterogeneity on the polarized angular signature often used to retrieve cloud or aerosol properties. We show that 3D effects are weak for flat clouds but become quite significant for fractional clouds above ocean. The 3D effects are quite different according to the observation scale. For the airborne scale (few tens of meter), solar illumination effects can lead to polarized cloud reflectance values higher than the saturation limit predicted by the homogeneous cloud assumption. In the cloud gaps, corresponding to shadowed areas of the total reflectances, polarized signal can also be enhanced

  2. Multielement analysis of environmental samples by total-reflection X-ray fluorescence sprectrometry, neutron activation analysis and inductively coupled plasma optical emission spectroscopy

    International Nuclear Information System (INIS)

    Michaelis, W.

    1986-01-01

    In environmental research and protection trace elements have to be determined over a wide range of atomic number, down to very low concentrations, and in quite different matrices. This challenge requires the availability of complementary analytical methods characterized by a high detection power and few sources of systematic errors. Besides, the capacity of multielement detection is often desired since it facilitates the talking of many problems in which numerous trace elements are of direct concern. Total-reflection X-ray fluorescence, neutron activation analysis and inductively coupled plasma optical emission spectroscopy, in principle fulfill these requirements quite well. However, each method has its domain, and the application to certain sample species may be less promising. Under this aspect, the paper summarizes some recent developments and investigations, including intercomparisons as far as possible. Various matrices are considered : rainwater and airborne particulates, soil samples, river sediments and suspended particulate matter, river water filtrates, ozean water, and organic matrices. Capabilities and limitations are discussed. Sample preparation techniques are described if they are new or essential for achieving the results given. (orig.) [de

  3. Operando Soft X-ray Absorption Spectroscopic Study on a Solid Oxide Fuel Cell Cathode during Electrochemical Oxygen Reduction.

    Science.gov (United States)

    Nakamura, Takashi; Oike, Ryo; Kimura, Yuta; Tamenori, Yusuke; Kawada, Tatsuya; Amezawa, Koji

    2017-05-09

    An operando soft X-ray absorption spectroscopic technique, which enabled the analysis of the electronic structures of the electrode materials at elevated temperature in a controlled atmosphere and electrochemical polarization, was established and its availability was demonstrated by investigating the electronic structural changes of an La 2 NiO 4+δ dense-film electrode during an electrochemical oxygen reduction reaction. Clear O K-edge and Ni L-edge X-ray absorption spectra could be obtained below 773 K under an atmospheric pressure of 100 ppm O 2 /He, 0.1 % O 2 /He, and 1 % O 2 /He gas mixtures. Considerable spectral changes were observed in the O K-edge X-ray absorption spectra upon changing the PO2 and application of electrical potential, whereas only small spectral changes were observed in Ni L-edge X-ray absorption spectra. A pre-edge peak of the O K-edge X-ray absorption spectra, which reflects the unoccupied partial density of states of Ni 3d-O 2p hybridization, increased or decreased with cathodic or anodic polarization, respectively. The electronic structural changes of the outermost orbital of the electrode material due to electrochemical polarization were successfully confirmed by the operando X-ray absorption spectroscopic technique developed in this study. © 2017 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.

  4. Evaluation of Fe and Zn/Cu ratio in serum of patients with sickle cell anemia by total reflection X-ray fluorescence using synchrotron radiation

    International Nuclear Information System (INIS)

    Canellas, Catarine G.L.; Leitao, Roberta G.; Lopes, Ricardo T.; Bellido, Alfredo Victor B.; Anjos, Marcelino J.

    2011-01-01

    Sickle cell anemia (SCA) is a blood disorder that affects hemoglobin, the protein found in red blood cells that help carry oxygen throughout the body. In this work we have analyzed serum samples from patients with SCA by using total reflection X-ray fluorescence using synchrotron radiation (SRTXRF). The SRTXRF measurements were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, Sao Paulo using a polychromatic beam. We have studied forty-three patients aged 18-50 years old, suffering from SCA and Sixty healthy volunteers aged 18-60 years old. It was possible to determine the concentrations of the following elements: P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb. Student's t-test was applied in order to check whether the two populations (CG x SCA) had the same mean values. It was observed that elemental concentration of P, Cl, K, Fe, Cu, Zn and Br differed significantly (α = 0.05) between groups of healthy subjects and SCA. The concentrations of K, Fe and Cu in the serum samples of patients with SCA were larger 15%, 120 % and 20 %, respectively, when compared with the CG. On the other hand, the concentrations of P (-20 %), Cl (-6 %), Zn (-25 %) and Br (-22 %) were smaller than the values determined for the control group. The serum level Cu/Zn ratio was significantly higher (60%) in the serum samples of patients with SCA group than the CG. So, the Cu/Zn ratio can be used as an adjuvant index in enhancement for diagnosis of SCA. There are evidences of an association among Fe, Cu, Zn and Cu/Zn in the SCA pathogenesis process. (author)

  5. Evaluation of Fe and Zn/Cu ratio in serum of patients with sickle cell anemia by total reflection X-ray fluorescence using synchrotron radiation

    Energy Technology Data Exchange (ETDEWEB)

    Canellas, Catarine G.L.; Leitao, Roberta G; Lopes, Ricardo T., E-mail: catarine@lin.ufrj.b, E-mail: ricardo@lin.ufrj.b [Universidade Federal do Rio de Janeiro (PEN/COPPE/UFRJ), RJ (Brazil). Coordenacao dos Programas de Pos-Graduacao de Engenharia. Programa de Engenharia Nuclear. Lab. de Instrumentaco Nuclear; Carvalho, Silvia M.F., E-mail: silvia@hemorio.rj.gov.b [State Institute of Hematology Arthur de Siqueira Cavalcanti (HEMORIO), Rio de Janeiro, RJ (Brazil); Bellido, Alfredo Victor B., E-mail: alfredo@ien.gov.b [Federal Fluminense University (UFF), Niteroi, RJ (Brazil). Chemistry Inst.; Anjos, Marcelino J., E-mail: marcelin@lin.ufrj.b [State University of Rio de Janeiro (UERJ), RJ (Brazil). Physics Inst.

    2011-07-01

    Sickle cell anemia (SCA) is a blood disorder that affects hemoglobin, the protein found in red blood cells that help carry oxygen throughout the body. In this work we have analyzed serum samples from patients with SCA by using total reflection X-ray fluorescence using synchrotron radiation (SRTXRF). The SRTXRF measurements were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, Sao Paulo using a polychromatic beam. We have studied forty-three patients aged 18-50 years old, suffering from SCA and Sixty healthy volunteers aged 18-60 years old. It was possible to determine the concentrations of the following elements: P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb. Student's t-test was applied in order to check whether the two populations (CG x SCA) had the same mean values. It was observed that elemental concentration of P, Cl, K, Fe, Cu, Zn and Br differed significantly ({alpha} = 0.05) between groups of healthy subjects and SCA. The concentrations of K, Fe and Cu in the serum samples of patients with SCA were larger 15%, 120 % and 20 %, respectively, when compared with the CG. On the other hand, the concentrations of P (-20 %), Cl (-6 %), Zn (-25 %) and Br (-22 %) were smaller than the values determined for the control group. The serum level Cu/Zn ratio was significantly higher (60%) in the serum samples of patients with SCA group than the CG. So, the Cu/Zn ratio can be used as an adjuvant index in enhancement for diagnosis of SCA. There are evidences of an association among Fe, Cu, Zn and Cu/Zn in the SCA pathogenesis process. (author)

  6. Spatially resolved single crystal x-ray spectropolarimetry of wire array z-pinch plasmas.

    Science.gov (United States)

    Wallace, M S; Haque, S; Neill, P; Pereira, N R; Presura, R

    2018-01-01

    A recently developed single-crystal x-ray spectropolarimeter has been used to record paired sets of polarization-dependent and axially resolved x-ray spectra emitted by wire array z-pinches. In this measurement, two internal planes inside a suitable crystal diffract the x-rays into two perpendicular directions that are normal to each other, thereby separating incident x-rays into their linearly polarized components. This paper gives considerations for fielding the instrument on extended sources. Results from extended sources are difficult to interpret because generally the incident x-rays are not separated properly by the crystal. This difficulty is mitigated by using a series of collimating slits to select incident x-rays that propagate in a plane of symmetry between the polarization-splitting planes. The resulting instrument and some of the spatially resolved polarized x-ray spectra recorded for a 1-MA aluminum wire array z-pinch at the Nevada Terawatt Facility at the University of Nevada, Reno will be presented.

  7. Soft X-ray reflectivity: from quasi-perfect mirrors to accelerator walls

    CERN Document Server

    Schäfers, F.

    2013-04-22

    Reflection of light from surfaces is a very common, but complex phenomenon not only in science and technology, but in every day life. The underlying basic optical principles have been developed within the last five centuries using visible light available from the sun or other laboratory light sources. X-rays were detected in 1895, and the full potential of soft- and hard-x ray radiation as a probe for the electronic and geometric properties of matter, for material analysis and its characterisation is available only since the advent of synchrotron radiation sources some 50 years ago. On the other hand high-brilliance and high power synchrotron radiation of present-days 3rd and 4th generation light sources is not always beneficial. Highenergy machines and accelerator-based light sources can suffer from a serious performance drop or limitations due to interaction of the synchrotron radiation with the accelerator walls, thus producing clouds of photoelectrons (e-cloud) which in turn interact with the accelerated ...

  8. Ultra-wideband reflective polarization converter based on anisotropic metasurface

    International Nuclear Information System (INIS)

    Wu Jia-Liang; Lin Bao-Qin; Da Xin-Yu

    2016-01-01

    In this paper, we propose an ultra-wideband reflective linear cross-polarization converter based on anisotropic metasurface. Its unit cell is composed of a square-shaped resonator with intersectant diagonal and metallic ground sheet separated by dielectric substrate. Simulated results show that the converter can generate resonances at four frequencies under normal incident electromagnetic (EM) wave, leading to the bandwidth expansion of cross-polarization reflection. For verification, the designed polarization converter is fabricated and measured. The measured and simulated results agree well with each other, showing that the fabricated converter can convert x - or y -polarized incident wave into its cross polarized wave in a frequency range from 7.57 GHz to 20.46 GHz with a relative bandwidth of 91.2%, and the polarization conversion efficiency is greater than 90%. The proposed polarization converter has a simple geometry but an ultra wideband compared with the published designs, and hence possesses potential applications in novel polarization-control devices. (paper)

  9. X-ray supermirrors for BESSY II

    International Nuclear Information System (INIS)

    Erko, A.; Schaefers, F.; Vidal, B.; Yakshin, A.; Pietsch, U.; Mahler, W.

    1995-01-01

    X-ray multilayer supermirrors for the energy range up to 20 keV have been theoretically studied and experimentally measured with synchrotron radiation. A multilayer mirror with 50 W/Si bilayers with different thicknesses on the Si substrate has a smooth reflectivity of up to 32% in the whole energy range from 5 to 22 keV at a grazing incidence angle of 0.32 degree which is considerably larger than using total external reflection. copyright 1995 American Institute of Physics

  10. Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films

    International Nuclear Information System (INIS)

    Kowarik, S.; Gerlach, A.; Leitenberger, W.; Hu, J.; Witte, G.; Woell, C.; Pietsch, U.; Schreiber, F.

    2007-01-01

    We use energy-dispersive X-ray reflectivity and grazing incidence diffraction (GID) to follow the growth of the crystalline organic semiconductor pentacene on silicon oxide in-situ and in real-time. The technique allows for monitoring Bragg reflections and measuring X-ray growth oscillations with a time resolution of 1 min in a wide q-range in reciprocal space extending over 0.25-0.80 A -1 , i.e. sampling a large number of Fourier components simultaneously. A quantitative analysis of growth oscillations at several q-points yields the evolution of the surface roughness, showing a marked transition from layer-by-layer growth to strong roughening after four monolayers of pentacene have been deposited

  11. Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers.

    Science.gov (United States)

    Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto; Maeda, Yoshitomo; Yamasaki, Noriko Y; Mitsuda, Kazuhisa; Shirata, Takayuki; Hayashi, Takayuki; Takano, Takayuki; Maeda, Ryutaro

    2010-02-20

    The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K(alpha)0.28 keV and Al K(alpha)1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K(alpha) (approximately 6 nm rms) is significantly larger than approximately 1 nm at Al K(alpha). This can be explained by different coherent lengths at two energies.

  12. Evaluation of the soft x-ray reflectivity of micropore optics using anisotropic wet etching of silicon wafers

    Energy Technology Data Exchange (ETDEWEB)

    Mitsuishi, Ikuyuki; Ezoe, Yuichiro; Koshiishi, Masaki; Mita, Makoto; Maeda, Yoshitomo; Yamasaki, Noriko Y.; Mitsuda, Kazuhisa; Shirata, Takayuki; Hayashi, Takayuki; Takano, Takayuki; Maeda, Ryutaro

    2010-02-20

    The x-ray reflectivity of an ultralightweight and low-cost x-ray optic using anisotropic wet etching of Si (110) wafers is evaluated at two energies, C K{alpha}0.28 keV and Al K{alpha}1.49 keV. The obtained reflectivities at both energies are not represented by a simple planar mirror model considering surface roughness. Hence, an geometrical occultation effect due to step structures upon the etched mirror surface is taken into account. Then, the reflectivities are represented by the theoretical model. The estimated surface roughness at C K{alpha} ({approx}6 nm rms) is significantly larger than {approx}1 nm at Al K{alpha}. This can be explained by different coherent lengths at two energies.

  13. Comparison of the X-Ray and Radio Light Curves of Quasar PKS 1510--089

    Science.gov (United States)

    Aller, M. F.; Marscher, A. P.; Marchenko-Jorstad, S. G.; McHardy, I. M.; Aller, H. D.

    1998-01-01

    We present results for the X-ray-bright superluminal AGN PKS 1510-089 (z=0.36) monitored weekly with the Rossi X-Ray Timing Explorer for the past four years in order to study the origin of X-ray emission from this extremely variable blazer. These RXTE data are compared with weekly cm-band flux and polarization observations from the Michigan Diameter telescope, to identify correlated activity and associated frequency-dependent time delays for constraining X-ray emission models; and bimonthly 7mm VLBA total and linearly polarized intensity imaging to identify temporal associations between X-ray events and the ejection of superluminal components and disturbances in the magnetic field, to test if the X-ray energy release is related to changes in the inner jet flow. Both the X-ray (2-20 keV) and radio flux are highly variable on timescales of weeks. The VLBA mas structure is dominated by a bright core with a weak jet; both the ejection of very fast superluminal knots and changes in the fractional polarization and EVPA of the core on timescales of one to four months are identified. Two outbursts in 1997 are well-resolved in both the centimeter and X-ray bands. Both the strong temporal association and the similar outburst shape support a causal relation, and a discrete cross-correlation analysis identifies that the X-ray lags the radio by 16 days during the bursts. Starting in 1998 the behavior changes: the correlation is weaker with the X-ray possibly leading the radio by six days. During the full time window there is a correlation between bands as expected if the radio photons are upscattered to X-ray energies. The time correlations and difference between the flat X-ray spectral index (0.0 <= alpha <= 0.5 where F(sub v) is proportional to v(exp -alpha)), and the mm-wave synchrotron spectrum (alpha = 0.8) are discussed within the framework of viable SSC models.

  14. X-ray Reflectivity Study of Ionic Liquids at Electrified Surfaces

    Science.gov (United States)

    Chu, Miaoqi

    X-ray reflectivity (XRR) versatile technique that characterize the surface structures. However, due to the lack of phase information of X-ray data, the reconstruction of electron density profile (EDP) from XRR data is an ill-posed inverse problem that requires extra attention. In Chapter 1, several key concepts in XRR data analysis are reviewed. The typical XRR data acquisition procedure and methods of modeling electron density are introduced. The widely used logarithm form of merit function is justified with mathematical deduction and numerical experiment. A scheme that generates artificial reflectivity data with theoretical statistical error but not systematical error is proposed. With the methods and schemes described in Chapter 1, simulated reflectivity data of a simple one-slab model is generated and fitted to test the efficient of EDP reconstruction. By isolating the parameters, the effects of slab width, electron density contrast and maximal wave transfer are studied individually. It?s demonstrated that best-fit/global minima, result reported by most XRR studies, don?t necessary reflect the real EDP. By contrast, mapping the merit function in the parametric space can capture much more details. Additionally, the widely accepted concept about the XRR theoretical spatial resolution (pi/q_{max}) as well the using Patterson function are brought to test. In the perspective of XRR data analysis, this chapter puts forward general rules to design and optimize XRR experiments. It also demonstrates how susceptible the fitting result will be if it?s not done carefully. In Chapter 3, the interface between hydrophobic OTS film and several solvents is studied with XRR in a transmission-cell setup. The solvents, from water, acetone, to alcohol (methanol, ethanol, 1-propanol), to alkane (pentane, hexane and heptane), vary significantly in terms of polarity and hydrogen bonding. However, the XRR data from different solvents are subtle. The methods and principles elicited in

  15. New trends in space x-ray optics

    Science.gov (United States)

    Hudec, R.; Maršíková, V.; Pína, L.; Inneman, A.; Skulinová, M.

    2017-11-01

    The X-ray optics is a key element of various X-ray telescopes, X-ray microscopes, as well as other X-ray imaging instruments. The grazing incidence X-ray lenses represent the important class of X-ray optics. Most of grazing incidence (reflective) X-ray imaging systems used in astronomy but also in other (laboratory) applications are based on the Wolter 1 (or modified) arrangement. But there are also other designs and configurations proposed, used and considered for future applications both in space and in laboratory. The Kirkpatrick-Baez (K-B) lenses as well as various types of Lobster-Eye optics and MCP/Micropore optics serve as an example. Analogously to Wolter lenses, the X-rays are mostly reflected twice in these systems to create focal images. Various future projects in X-ray astronomy and astrophysics will require large segments with multiple thin shells or foils. The large Kirkpatrick-Baez modules, as well as the large Lobster-Eye X-ray telescope modules in Schmidt arrangement may serve as examples. All these space projects will require high quality and light segmented shells (bent or flat foils) with high X-ray reflectivity and excellent mechanical stability. The Multi Foil Optics (MFO) approach represent a promising alternative for both LE and K-B X-ray optical modules. Several types of reflecting substrates may be considered for these applications, with emphasis on thin float glass sheets and, more recently, high quality silicon wafers. This confirms the importance of non- Wolter X-ray optics designs for the future. Future large space X-ray telescopes (such as IXO) require precise and light-weight X-ray optics based on numerous thin reflecting shells. Novel approaches and advanced technologies are to be exploited and developed. In this contribution, we refer on results of tested X-ray mirror shells produced by glass thermal forming (GTF) and by shaping Si wafers. Both glass foils and Si wafers are commercially available, have excellent surface

  16. Probing the gravitational Faraday rotation using quasar X-ray microlensing.

    Science.gov (United States)

    Chen, Bin

    2015-11-17

    The effect of gravitational Faraday rotation was predicted in the 1950s, but there is currently no practical method for measuring this effect. Measuring this effect is important because it will provide new evidence for correctness of general relativity, in particular, in the strong field limit. We predict that the observed degree and angle of the X-ray polarization of a cosmologically distant quasar microlensed by the random star field in a foreground galaxy or cluster lens vary rapidly and concurrently with flux during caustic-crossing events using the first simulation of quasar X-ray microlensing polarization light curves. Therefore, it is possible to detect gravitational Faraday rotation by monitoring the X-ray polarization of gravitationally microlensed quasars. Detecting this effect will also confirm the strong gravity nature of quasar X-ray emission.

  17. Studies and developments for the analysis of products of nuclear reprocessing plants with the help of the X-ray fluorescence analysis on totally reflecting sample holders (TXRF)

    International Nuclear Information System (INIS)

    Diercks, H.; Eggers, I.; Gibau, F.; Haarich, M.; Hastenteufel, S.; Haurand, M.; Knoechel, A.; Salow, H.

    1990-01-01

    Studies with inactive and active simulates of products of nuclear reprocessing plants show the suitability of the X-Ray Fluorescence Analysis on Totally Reflecting Sample Holders (TXRF), to detect the available elements simultaneously by direct measurements of specially prepared thin samples. High dilution enables in the most cases, to avoid working in hot cells and to carry out the analysis in glove boxes. The analysis of uranium products and great amounts of matrix elements containing solutions like LAW and MAW demands the separation of the matrix elements before TXRF measurement. Procedures for this task have been developed. The potential of the new analytical procedure was demonstrated by the analysis of two samples of highly diluted high active wastes. (orig.) With 65 refs., 20 tabs., 81 figs [de

  18. An ultrahigh-vacuum apparatus for resonant diffraction experiments using soft x rays (hν=300-2000 eV)

    International Nuclear Information System (INIS)

    Takeuchi, T.; Chainani, A.; Takata, Y.; Tanaka, Y.; Oura, M.; Tsubota, M.; Senba, Y.; Ohashi, H.; Mochiku, T.; Hirata, K.; Shin, S.

    2009-01-01

    We have developed an ultrahigh-vacuum instrument for resonant diffraction experiments using polarized soft x rays in the energy range of hν=300-2000 eV at beamline BL17SU of SPring-8. The diffractometer consists of modified differentially pumped rotary feedthroughs for θ-2θ stages, a sample manipulator with motor-controlled x-y-z-, tilt (χ)-, and azimuth (φ)-axes, and a liquid helium flow-type cryostat for temperature dependent measurements between 30 and 300 K. Test results indicate that the diffractometer exhibits high reproducibility (better than 0.001 deg.) for a Bragg reflection of α-quartz 100 at a photon energy of hν=1950 eV. Typical off- and on-resonance Bragg reflections in the energy range of 530-1950 eV could be measured using the apparatus. The results show that x-ray diffraction experiments with energy-, azimuth-, and incident photon polarization-dependence can be reliably measured using soft x rays in the energy range of ∼300-2000 eV. The facility can be used for resonant diffraction experiments across the L-edge of transition metals, M-edge of lanthanides, and up to the Si K-edge of materials.

  19. Speciation of copper and zinc in size-fractionated atmospheric particulate matter using total reflection mode X-ray absorption near-edge structure spectrometry

    International Nuclear Information System (INIS)

    Osan, Janos; Meirer, Florian; Groma, Veronika; Toeroek, Szabina; Ingerle, Dieter; Streli, Christina; Pepponi, Giancarlo

    2010-01-01

    The health effects of aerosol depend on the size distribution and the chemical composition of the particles. Heavy metals of anthropogenic origin are bound to the fine aerosol fraction (PM 2.5 ). The composition and speciation of aerosol particles can be variable in time, due to the time-dependence of anthropogenic sources as well as meteorological conditions. Synchrotron-radiation total reflection X-ray fluorescence (SR-TXRF) provides very high sensitivity for characterization of atmospheric particulate matter. X-ray absorption near-edge structure (XANES) spectrometry in conjunction with TXRF detection can deliver speciation information on heavy metals in aerosol particles collected directly on the reflector surface. The suitability of TXRF-XANES for copper and zinc speciation in size-fractionated atmospheric particulate matter from a short sampling period is presented. For high size resolution analysis, atmospheric aerosol particles were collected at different urban and rural locations using a 7-stage May cascade impactor having adapted for sampling on Si wafers. The thin stripe geometry formed by the particulate matter deposited on the May-impactor plates is ideally suited to SR-TXRF. Capabilities of the combination of the May-impactor sampling and TXRF-XANES measurements at HASYLAB Beamline L to Cu and Zn speciation in size-fractionated atmospheric particulate matter are demonstrated. Information on Cu and Zn speciation could be performed for elemental concentrations as low as 140 pg/m 3 . The Cu and Zn speciation in the different size fraction was found to be very distinctive for samples of different origin. Zn and Cu chemical state typical for soils was detected only in the largest particles studied (2-4 μm fraction). The fine particles, however, contained the metals of interest in the sulfate and nitrate forms.

  20. Reflection-mode x-ray powder diffraction cell for in situ studies of electrochemical reactions

    International Nuclear Information System (INIS)

    Roberts, G.A.; Stewart, K.D.

    2004-01-01

    The design and operation of an electrochemical cell for reflection-mode powder x-ray diffraction experiments are discussed. The cell is designed for the study of electrodes that are used in rechargeable lithium batteries. It is designed for assembly in a glove box so that air-sensitive materials, such as lithium foil electrodes and carbonate-based electrolytes with lithium salts, can be used. The cell uses a beryllium window for x-ray transmission and electrical contact. A simple mechanism for compressing the electrodes is included in the design. Sample results for the cell are shown with a Cu Kα source and a position-sensitive detector

  1. Isolated elliptically polarized attosecond soft X-ray with high-brilliance using polarization gating of harmonics from relativistic plasmas at oblique incidence.

    Science.gov (United States)

    Chen, Zi-Yu; Li, Xiao-Ya; Li, Bo-Yuan; Chen, Min; Liu, Feng

    2018-02-19

    The production of intense isolated attosecond pulse is a major goal in ultrafast research. Recent advances in high harmonic generation from relativistic plasma mirrors under oblique incidence interactions gave rise to photon-rich attosecond pulses with circular or elliptical polarization. However, to achieve an isolated elliptical attosecond pulse via polarization gating using currently available long driving pulses remains a challenge, because polarization gating of high harmonics from relativistic plasmas is assumed only possible at normal or near-normal incidence. Here we numerically demonstrate a scheme around this problem. We show that via control of plasma dynamics by managing laser polarization, it is possible to gate an intense single attosecond pulse with high ellipticity extending to the soft X-ray regime at oblique incidence. This approach thus paves the way towards a powerful tool enabling high-time-resolution probe of dynamics of chiral systems and magnetic materials with current laser technology.

  2. High-precision soft x-ray polarimeter at Diamond Light Source.

    Science.gov (United States)

    Wang, H; Dhesi, S S; Maccherozzi, F; Cavill, S; Shepherd, E; Yuan, F; Deshmukh, R; Scott, S; van der Laan, G; Sawhney, K J S

    2011-12-01

    The development and performance of a high-precision polarimeter for the polarization analysis in the soft x-ray region is presented. This versatile, high-vacuum compatible instrument is supported on a hexapod to simplify the alignment with a resolution less than 5 μrad, and can be moved with its own independent control system easily between different beamlines and synchrotron facilities. The polarimeter can also be used for the characterization of reflection and transmission properties of optical elements. A W/B(4)C multilayer phase retarder was used to characterize the polarization state up to 1200 eV. A fast and accurate alignment procedure was developed, and complete polarization analysis of the APPLE II undulator at 712 eV has been performed.

  3. Study of properties of chemically modified samples of halloysite mineral with X-ray fluorescence and X-ray powder diffraction methods

    International Nuclear Information System (INIS)

    Banaś, D.; Kubala-Kukuś, A.; Braziewicz, J.; Majewska, U.; Pajek, M.; Wudarczyk-Moćko, J.; Czech, K.; Garnuszek, M.; Słomkiewicz, P.; Szczepanik, B.

    2013-01-01

    Elemental and chemical composition of raw and activated samples of halloysite mineral using wavelength dispersive X-ray fluorescence (WDXRF), total reflection X-ray fluorescence (TXRF) and X-ray powder diffraction (XRPD) methods were determined. As the result, it has been shown that application of the complementary X-ray spectrometry techniques allows very precise observation of changes in composition of halloysite mineral samples caused by its chemical modifications. Sample preparation procedure and usability of the research methods applied are described in details. Procedure of activation of raw halloysite mineral samples by etching them in sulfuric acid of various concentrations has been described and discussed. The ability of the samples to adsorb lead from intentionally contaminated water was tested and confirmed. - Author-Highlights: • We measured elemental and chemical composition of raw and activated halloysite mineral samples. • We showed that X-ray techniques allow precise study of changes in the sample composition. • We describe procedure of activation of the samples by etching them in sulfuric acid. • We tested ability of halloysite mineral to absorb lead from contaminated water

  4. Iron overload of human colon adenocarcinoma cells studied by synchrotron-based X-ray techniques

    NARCIS (Netherlands)

    Mihucz, Victor G.; Meirer, Florian; Polgári, Zsófia; Réti, Andrea; Pepponi, Giancarlo; Ingerle, Dieter; Szoboszlai, Norbert; Streli, Christina

    2016-01-01

    Fast- and slow-proliferating human adenocarcinoma colorectal cells, HT-29 and HCA-7, respectively, overloaded with transferrin (Tf), Fe(III) citrate, Fe(III) chloride and Fe(II) sulfate were studied by synchrotron radiation total-reflection X-ray spectrometry (TXRF), TXRF-X-ray absorption near edge

  5. X-ray absorption and reflection as probes of the GaN conduction bands: Theory and experiments

    Energy Technology Data Exchange (ETDEWEB)

    Lambrecht, W.R.L.; Rashkeev, S.N.; Segall, B. [Case Western Reserve Univ., Cleveland, OH (United States)] [and others

    1997-04-01

    X-ray absorption measurements are a well-known probe of the unoccupied states in a material. The same information can be obtained by using glancing angle X-ray reflectivity. In spite of several existing band structure calculations of the group III nitrides and previous optical studies in UV range, a direct probe of their conduction band densities of states is of interest. The authors performed a joint experimental and theoretical investigation using both of these experimental techniques for wurtzite GaN.

  6. Evaluation of Fe and Zn/Cu ratio in serum of patients with sickle cell anemia by total reflection X-ray fluorescence using synchrotron radiation

    Energy Technology Data Exchange (ETDEWEB)

    Canellas, Catarine G.L.; Leitao, Roberta G.; Lopes, Ricardo T., E-mail: catarine@lin.ufrj.b, E-mail: ricardo@lin.ufrj.b [Universidade Federal do Rio de Janeiro (PEN/COPPE/UFRJ), RJ (Brazil). Coordenacao dos Programas de Pos-Graduacao de Engenharia. Programa de Engenharia Nuclear. Lab. de Instrumentaco Nuclear; Carvalho, Silvia M.F., E-mail: silvia@hemorio.rj.gov.b [State Institute of Hematology Arthur de Siqueira Cavalcanti (HEMORIO), Rio de Janeiro, RJ (Brazil); Bellido, Alfredo Victor B., E-mail: alfredo@ien.gov.b [Federal Fluminense University (UFF), Niteroi, RJ (Brazil). Chemistry Inst.; Anjos, Marcelino J., E-mail: marcelin@lin.ufrj.b [State University of Rio de Janeiro (UERJ), RJ (Brazil). Physics Inst.

    2011-07-01

    Sickle cell anemia (SCA) is a blood disorder that affects hemoglobin, the protein found in red blood cells that help carry oxygen throughout the body. In this work we have analyzed serum samples from patients with SCA by using total reflection X-ray fluorescence using synchrotron radiation (SRTXRF). The SRTXRF measurements were performed at the X-ray fluorescence beamline at Brazilian National Synchrotron Light Laboratory (LNLS), in Campinas, Sao Paulo using a polychromatic beam. We have studied forty-three patients aged 18-50 years old, suffering from SCA and Sixty healthy volunteers aged 18-60 years old. It was possible to determine the concentrations of the following elements: P, S, Cl, K, Ca, Fe, Cu, Zn, Br and Rb. Student's t-test was applied in order to check whether the two populations (CG x SCA) had the same mean values. It was observed that elemental concentration of P, Cl, K, Fe, Cu, Zn and Br differed significantly ({alpha} = 0.05) between groups of healthy subjects and SCA. The concentrations of K, Fe and Cu in the serum samples of patients with SCA were larger 15%, 120 % and 20 %, respectively, when compared with the CG. On the other hand, the concentrations of P (-20 %), Cl (-6 %), Zn (-25 %) and Br (-22 %) were smaller than the values determined for the control group. The serum level Cu/Zn ratio was significantly higher (60%) in the serum samples of patients with SCA group than the CG. So, the Cu/Zn ratio can be used as an adjuvant index in enhancement for diagnosis of SCA. There are evidences of an association among Fe, Cu, Zn and Cu/Zn in the SCA pathogenesis process. (author)

  7. Reduction of cross-polarized reflection to enhance dual-band absorption

    Science.gov (United States)

    Kundu, Debidas; Mohan, Akhilesh; Chakrabarty, Ajay

    2016-11-01

    In this paper, cross-polarized reflection from a periodic array of metal-dielectric-metal resonator units is reduced to improve its absorbing performance. Through this simple and typical example, it is shown that some reported absorbers are actually poor absorbers but efficient polarization converters, when the cross-polarized reflection is considered. Using a frequency selective surface, sandwiched between the top layer and the ground plane, the cross-polarized reflection is reduced by 7.2 dB at 5.672 GHz and 8.5 dB at 9.56 GHz, while negligibly affecting the co-polarized reflection reduction performance. The polarization conversion ratio is reduced from 90. 74% to 34.12% and 98.51% to 27.2% and total absorption is improved up to 80% from 26% and 21% around the two resonant frequencies. The reflection characteristics of the proposed absorber are quantitatively analyzed using interference theory, where the near field coupling of the resonant geometries and ground is taken into account. Measurement results show good agreement with both the numerically simulated and theoretical results.

  8. Application of CO2 Snow Jet Cleaning in Conjunction with Laboratory Based Total Reflection X-Ray Fluorescence

    Science.gov (United States)

    Schmeling, M.; Burnett, D. S.; Allton, J. H.; Rodriquez, M.; Tripa, C. E.; Veryovkin, I. V.

    2013-01-01

    The Genesis mission was the first mission returning solar material to Earth since the Apollo program [1,2]. Unfortunately the return of the space craft on September 8, 2004 resulted in a crash landing, which shattered the samples into small fragments and exposed them to desert soil and other debris. Thus only small fragments of the original collectors are available, each having different degrees of surface contamination. Thorough surface cleaning is required to allow for subsequent analysis of solar wind material embedded within. An initial cleaning procedure was developed in coordination with Johnson Space Center which focused on removing larger sized particulates and a thin film organic contamination acquired during collection in space [3]. However, many of the samples have additional residues and more rigorous and/or innovative cleaning steps might be necessary. These cleaning steps must affect only the surface to avoid leaching and re-distribution of solar wind material from the bulk of the collectors. To aid in development and identification of the most appropriate cleaning procedures each sample has to be thoroughly inspected before and after each cleaning step. Laboratory based total reflection X-ray fluorescence (TXRF) spectrometry lends itself to this task as it is a non-destructive and surface sensitive analytical method permitting analysis of elements from aluminum onward present at and near the surface of a flat substrate [4]. The suitability of TXRF has been demonstrated for several Genesis solar wind samples before and after various cleaning methods including acid treatment, gas cluster ion beam, and CO2 snow jet [5 - 7]. The latter one is non-invasive and did show some promise on one sample [5]. To investigate the feasibility of CO2 snow jet cleaning further, several flown Genesis samples were selected to be characterized before and after CO2 snow application with sample 61052 being discussed below.

  9. Ultra-wideband reflective polarization converter based on anisotropic metasurface

    Science.gov (United States)

    Wu, Jia-Liang; Lin, Bao-Qin; Da, Xin-Yu

    2016-08-01

    In this paper, we propose an ultra-wideband reflective linear cross-polarization converter based on anisotropic metasurface. Its unit cell is composed of a square-shaped resonator with intersectant diagonal and metallic ground sheet separated by dielectric substrate. Simulated results show that the converter can generate resonances at four frequencies under normal incident electromagnetic (EM) wave, leading to the bandwidth expansion of cross-polarization reflection. For verification, the designed polarization converter is fabricated and measured. The measured and simulated results agree well with each other, showing that the fabricated converter can convert x- or y-polarized incident wave into its cross polarized wave in a frequency range from 7.57 GHz to 20.46 GHz with a relative bandwidth of 91.2%, and the polarization conversion efficiency is greater than 90%. The proposed polarization converter has a simple geometry but an ultra wideband compared with the published designs, and hence possesses potential applications in novel polarization-control devices. Project supported by the National Natural Science Foundation of China (Grant Nos. 61471387, 61271250, and 61571460).

  10. Ionic liquids: an x-ray reflectivity study

    International Nuclear Information System (INIS)

    Sloutskin, E.; Deutsch, M.; Tamam, L.; Ocko, B.; Kuzmenko, I.; Gog, T.

    2005-01-01

    Full Text:Ionic liquids are non-volatile, non-flammable and thermally stable solvents, and as such are promising 'green' replacements for traditional volatile organic solvents. In the last years hundreds of Ionic liquids were synthesized. Due to the Ionic liquids great industrial potential, this number is growing at an exceedingly fast rate. Despite the great importance of the interfacial properties of materials for technological applications and basic science, the atomic-scale surface structure of the Ionic liquids has never been studied previously. In our study, synchrotron x-ray reflectivity and surface tensiometry were employed to obtain the surface structure and thermodynamics of two ionic liquids, based on the 1-alkyl-3-methylimidazolium cations. A molecular layer of a density ∼18% higher than that of the bulk is found to form at the free surface of these liquids. The excess concentration of the oppositely charged ions within the surface layer is determined by chemical substitution of the anion. Finally, the observed layering at the surface is contrasted with our measurements on the behavior of classical aqueous salt solutions

  11. Anisotropically biaxial strain in non-polar (112-0) plane In x Ga1-x N/GaN layers investigated by X-ray reciprocal space mapping.

    Science.gov (United States)

    Zhao, Guijuan; Li, Huijie; Wang, Lianshan; Meng, Yulin; Ji, Zesheng; Li, Fangzheng; Wei, Hongyuan; Yang, Shaoyan; Wang, Zhanguo

    2017-07-03

    In this study, the indium composition x as well as the anisotropically biaxial strain in non-polar a-plane In x Ga 1-x N on GaN is studied by X-ray diffraction (XRD) analysis. In accordance with XRD reciprocal lattice space mapping, with increasing indium composition, the maximum of the In x Ga 1-x N reciprocal lattice points progressively shifts from a fully compressive strained to a fully relaxed position, then to reversed tensile strained. To fully understand the strain in the ternary alloy layers, it is helpful to grow high-quality device structures using a-plane nitrides. As the layer thickness increases, the strain of In x Ga 1-x N layer releases through surface roughening and the 3D growth-mode.

  12. Measurement of the polarized neutron---polarized 3He total cross section

    International Nuclear Information System (INIS)

    Keith, C.D.; Gould, C.R.; Haase, D.G.; Seely, M.L.; Huffman, P.R.; Roberson, N.R.; Tornow, W.; Wilburn, W.S.

    1995-01-01

    The first measurements of polarized neutron--polarized 3 He scattering in the few MeV energy region are reported. The total cross section difference Δσ T for transversely polarized target and beam has been measured for neutron energies between 1.9 and 7.5 MeV. Comparison is made to predictions of Δσ T using various descriptions of the 4 He continuum. A brute-force polarized target of solid 3 He has been developed for these measurements. The target is 4.3x10 22 atoms/cm 2 thick and is polarized to 38% at 7 Telsa and 12 mK. copyright 1995 American Institute of Physics

  13. A submicron synchrotron X-ray beam generated by capillary optics

    International Nuclear Information System (INIS)

    Engstroem, P.; Larsson, S.; Rindby, A.; Buttkewitz, A.; Garbe, S.; Gaul, G.; Knoechel, A.; Lechtenberg, F.; Deutsches Elektronen-Synchrotron

    1991-01-01

    A novel capillary optics technique for focusing synchrotron X-ray beams has been applied in an experiment performed at the DORIS storage ring at HASYLAB. This new technqiue, which utilizes the total reflection properties of X-rays inside small capillaries, has recently been applied to generate microbeams of X-rays, with a beam size down to about 10 μm using conventional X-ray tubes. The result from our recent experiment shows that capillary optics can also be used to generate a submicron beam of X-rays from a synchrotron light source. A description of the capillary unit, and the alignment procedure is given. The influence of the thermal load on the device caused by the intense flux of synchrotron radiation will be discussed. Future perspectives of the capillary techniques as applied to synchrotron radiation will be discussed. (orig.)

  14. Density determination of langmuir-blodgett monolayer films using x-ray reflectivity technique

    International Nuclear Information System (INIS)

    Damar Yoga Kusuma

    2015-01-01

    Monolayer deposition by Langmuir-Blodgett technique produces monolayer films that are uniform with controllable thickness down to nanometer scale. To evaluate the quality of the monolayer deposition, X-ray reflectivity technique are employed to monitor the monolayers density. Langmuir-Blodgett monolayer with good coverage and uniformity results in film density close to its macroscopic film counterpart whereas films with presence of air gaps shows lower density compared to its macroscopic film counterpart. (author)

  15. Laboratory characterization of Woelter x-ray optics

    International Nuclear Information System (INIS)

    Remington, B.A.; Morales, R.I.

    1994-04-01

    We have conducted an extensive series of characterization measurements of a Woe1ter incidence x-ray microscope. The measurements were carried out on 5% sectors of the Woe1ter x-ray optic in a laboratory utilizing a high brightness, ''point'' x-ray source and fall into two categories. (1) Absolute reflectance measurements as a function of x-ray energy were made with Si(Li) detectors to acquire continuum spectra prior to and after reflecting off the Woe1ter optic. (2) Spatial resolution measurements were made using back-illuminated pinholes or grids imaged onto film or an x-ray CCD camera. The depth of field was mapped out by varying the distance between the Woe1ter optic and the backlit grid

  16. Effect of FEL induced ionization on X-ray reflectivity of multilayers

    Energy Technology Data Exchange (ETDEWEB)

    Ksenzov, Dmitriy; Grigorian, Souren; Pietsch, Ullrich [University of Siegen (Germany)

    2009-07-01

    The VUV-FEL in Hamburg (FLASH) emits short-pulse radiation with wavelengths from 6 to 30 nm and a pulse length of 10-50 fs. The FLASH wavelength allows x-ray diffraction experiments at periodical multilayer's structures acting as 1D crystal. The probe of depth selective interaction of the high-intense x-ray short pulse with these objects can be used to obtain information about possible electronic excitation and various recombination processes inside multilayers. As known from recent experiments at FLASH, the later ones are most likely using highly intense FEL radiation. The ML reflectivity is analyzed for case of that the optical parameters are changing as function of the depth of the penetrating incident pulse into the multilayer. The response is studied for the model system La/B{sub 4}C using two experimental conditions both at fixed incidence angle: 1) the energy of the incident pulses, E, coincides with the energy of the 1st order multilayer Bragg peak, E{sub B}, of the reflection curve, and 2) the energy of incident pulse differs by a small dE from E{sub B}. The ML response to a given sub-pulse differs for both conditions. However, there is a clear fingerprint of ionization for both conditions for the case that E is close to the K-absorption edge of B-atoms. Our results support respective efforts to measure the optical parameters of solids under high-intense FEL radiation.

  17. A high resolution reflecting crystal spectrometer to measure 3 keV pionic hydrogen and deuterium X-rays

    International Nuclear Information System (INIS)

    Badertscher, A.; Bogdan, M.; Goudsmit, P.F.A.; Knecht, L.; Leisi, H.J.; Schroeder, H.C.; Sigg, D.; Zhao, Z.G.; Chatellard, D.; Egger, J.P.; Jeannet, E.; Aschenauer, E.C.; Gabathuler, K.; Simons, L.M.; Rusi El Hassani, A.J.

    1993-01-01

    A reflecting crystal spectrometer consisting of three cylindrically bent quartz (110) crystals is described. It was designed to measure the 3 keV K β X-rays from pionic hydrogen and deuterium. Charge coupled devices (CCDs) were used as X-ray detectors. Projecting the reflexes of all three crystals on one common focus, an instrumental energy resolution below 1 eV was obtained at an energy of 2.9 keV. (orig.)

  18. Antiferroelectric surface layers in a liquid crystal as observed by synchrotron x-ray scattering

    DEFF Research Database (Denmark)

    Gramsbergen, E. F.; de Jeu, W. H.; Als-Nielsen, Jens Aage

    1986-01-01

    The X-ray reflectivity form the surface of a liquid crystal with terminally polar (cyano substituted) molecules has been studied using a high-resolution triple-axis X-ray spectrometer in combination with a synchrotron source. It is demonstrated that at the surface of the smectic Al phase a few...... antiferroelectric double layers develop that can be distinguished from the bulk single layer structure. A model is developed that separates the electron density in a contribution from the molecular form factor, and from the structure factor of the mono- and the bilayers, respectively. It shows that (i) the first...

  19. In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1{sub 0} ordering in {sup 57}Fe/Pt multilayers

    Energy Technology Data Exchange (ETDEWEB)

    Raghavendra Reddy, V; Gupta, Ajay; Gome, Anil [UGC-DAE Consortium for Scientific Research, University Campus, Khandwa Road, Indore-452 017 (India); Leitenberger, Wolfram [Institute of Physics, University of Potsdam, 14469 Potsdam (Germany); Pietsch, U [Physics Department, University of Siegen, D-57068 Siegen (Germany)], E-mail: vrreddy@csr.ernet.in, E-mail: varimalla@yahoo.com

    2009-05-06

    In situ high temperature x-ray reflectivity and grazing incidence x-ray diffraction measurements in the energy dispersive mode are used to study the ordered face-centered tetragonal (fct) L 1{sub 0} phase formation in [Fe(19 A)/Pt(25 A)]{sub x 10} multilayers prepared by ion beam sputtering. With the in situ x-ray measurements it is observed that (i) the multilayer structure first transforms to a disordered FePt and subsequently to an ordered fct L 1{sub 0} phase, (ii) the ordered fct L 1{sub 0} FePt peaks start to appear at 320 deg. C annealing, (iii) the activation energy of the interdiffusion is 0.8 eV and (iv) ordered fct FePt grains have preferential out-of-plane texture. The magneto-optical Kerr effect and conversion electron Moessbauer spectroscopies are used to study the magnetic properties of the as-deposited and 400 deg. C annealed multilayers. The magnetic data for the 400 {sup 0}C annealed sample indicate that the magnetization is at an angle of {approx}50 deg. from the plane of the film.

  20. Biofilms as bio-indicator for polluted waters? Total reflection X-ray fluorescence analysis of biofilms of the Tisza river (Hungary)

    Energy Technology Data Exchange (ETDEWEB)

    Mages, Margarete; Ovari, Mihaly; Tuempling, Wolf v. [Department of Inland Water Research Magdeburg, UFZ Centre for Environmental Research Leipzig-Halle, Brueckstrasse 3a, 39114, Magdeburg (Germany); Kroepfl, Krisztina [Department of Chemical Technology and Environmental Chemistry, Eoetvoes University, Pazmany Peter setany 1/A, 1117, Budapest (Hungary)

    2004-02-01

    The aim of this work was to investigate the heavy metal accumulation by natural biofilms living in the catchment area of the Tisza river in Hungary, as well as in biofilms cultivated in vitro. Laboratory tests have demonstrated that metals can be adsorbed on biofilms, depending on their concentration and on the availability of free sorptive places. Biofilms were cultivated in vitro in natural freshwater from the Saale river, Germany. After reaching the plateau phase, Cu was added to reach a concentration of 100 {mu}g/L. An increase of its mass fraction in the biofilm was observed, which caused the decrease of the concentration in the water phase. Unfortunately, the reactor wall was also found to act as adsorbent for Cu. More detailed results of our in vitro experiments will be published in a forthcoming paper. Naturally grown biofilm samples from exposed as well as background places at the Hungarian rivers Szamos and Tisza were collected in 2000 and 2002 after the cyanide spill, and analysed using total reflection X-ray fluorescence analysis (TXRF). Metal mass fraction differences as high as two orders of magnitude were found between polluted and unpolluted (background) sampling points. Extremely high concentration values, e.g. 5600 {mu}g/g Zn in biofilm, were found at highly polluted sampling points. This means an enrichment factor of ca. 10,000 compared to the water phase. (orig.)

  1. Optimization of polarimetry sensitivity for X-ray CCD

    CERN Document Server

    Hayashida, K; Tsunemi, H; Hashimoto, Y; Ohtani, M

    1999-01-01

    X-ray polarimetry with CCD has been performed using a polarized X-ray beam from an electron impact X-ray source. The standard data reduction method employing double-pixel events yields the modulation factor M of 0.14 at 27 keV and 0.24 at 43 keV for the 12 mu m pixel size CCD chip. We develop a new data reduction method, in which multi-pixel events are employed, and which approximates the charge spread as an oval shape. We optimize the reduction parameters, so that we improve the P sub m sub i sub n (minimum detectable polarization degree) by factor of three from the value obtained through the usual double-pixel event method.

  2. Viability of exploiting L-shell fluorescence for X-ray polarimetry

    Energy Technology Data Exchange (ETDEWEB)

    Weisskopf, M C; Elsner, R F; Ramsey, B D [National Aeronautics and Space Administration, Huntsville, AL (USA). Space Sciences Lab.; Sutherland, P G [McMaster Univ., Hamilton, Ontario (Canada). Dept. of Physics

    1985-05-15

    It has been suggested that one may build an X-ray polarimeter by exploiting the polarization dependence of the angular distribution of L-shell fluorescence photons. In this paper we examine, theoretically, the sensitivity of this approach to polarimetry. We apply our calculations to several detection schemes using imaging proportional counters that would have direct application in X-ray astronomy. We find, however, that the sensitivity of this method for measuring X-ray polarization is too low to be of use for other than laboratory applications.

  3. Polarizer reflectivity variations

    International Nuclear Information System (INIS)

    Ozarski, R.G.; Prior, J.

    1980-01-01

    On Shiva the beam energy along the chain is monitored using available reflections and/or transmission through beam steering, splitting, and polarizing optics without the intrusion of any additional glass for diagnostics. On the preamp table the diagnostic signal is obtained from the signal transmitted through turning mirrors. At the input of each chain the signal is obtained from the transmission through one of the mirrors used for the chain input alignment sensor (CHIP). At the chain output the transmission through the final turning mirror is used. These diagnostics have proved stable and reliable. However, one of the prime diagnostic locations is at the output of the beta rod. The energy at this location is measured by collecting small reflections from the last polarizer surface of the beta Pockels cell polarizer package. Unfortunately, calibration of this diagnostic has varied randomly, seldom remaining stable for a week or more. The cause of this fluctuation has been investigated for the past year and'it has been discovered that polarizer reflectivity varies with humidity. This report will deal with the possible causes that were investigated, the evidence that humidity is causing the variation, and the associated mechanism

  4. Determining surface coverage of ultra-thin gold films from X-ray reflectivity measurements

    International Nuclear Information System (INIS)

    Kossoy, A.; Simakov, D.; Olafsson, S.; Leosson, K.

    2013-01-01

    The paper describes usage of X-ray reflectivity for characterization of surface coverage (i.e. film continuity) of ultra-thin gold films which are widely studied for optical, plasmonic and electronic applications. The demonstrated method is very sensitive and can be applied for layers below 1 nm. It has several advantages over other techniques which are often employed in characterization of ultra-thin metal films, such as optical absorption, Atomic Force Microscopy, Transmission Electron Microscopy or Scanning Electron Microscopy. In contrast to those techniques our method does not require specialized sample preparation and measurement process is insensitive to electrostatic charge and/or presence of surface absorbed water. We validate our results with image processing of Scanning Electron Microscopy images. To ensure precise quantitative analysis of the images we developed a generic local thresholding algorithm which allowed us to treat series of images with various values of surface coverage with similar image processing parameters. - Highlights: • Surface coverage/continuity of ultra-thin Au films (up to 7 nm) was determined. • Results from X-ray reflectivity were verified by scanning electron microscopy. • We developed local thresholding algorithm to treat non-homogeneous image contrast

  5. ACTIVE GALAXY UNIFICATION IN THE ERA OF X-RAY POLARIMETRY

    International Nuclear Information System (INIS)

    Dorodnitsyn, A.; Kallman, T.

    2010-01-01

    Active galactic nuclei (AGNs), Seyfert galaxies, and quasars are powered by luminous accretion and often accompanied by winds that are powerful enough to affect the AGN mass budget, and whose observational appearance bears an imprint of processes that are happening within the central parsec around the black hole (BH). One example of such a wind is the partially ionized gas responsible for X-ray and UV absorption (warm absorbers). Here, we show that such gas will have a distinct signature when viewed in polarized X-rays. Observations of such polarization can test models for the geometry of the flow and the gas responsible for launching and collimating it. We present calculations that show that the polarization depends on the hydrodynamics of the flow, the quantum mechanics of resonance-line scattering, and the transfer of polarized X-ray light in the highly ionized moving gas. The results emphasize the three-dimensional nature of the wind for modeling spectra. We show that the polarization in the 0.1-10 keV energy range is dominated by the effects of resonance lines. We predict a 5%-25% X-ray polarization signature of type-2 objects in this energy range. These results are generalized to flows that originate from a cold torus-like structure, located ∼1 pc from the BH, which wraps the BH and is ultimately responsible for the apparent dichotomy between type 1 and type 2 AGNs. Such signals will be detectable by future dedicated X-ray polarimetry space missions, such as the NASA Gravity and Extreme Magnetism Small Explorer.

  6. Generation of neutron standing waves at total reflection of polarized neutrons

    International Nuclear Information System (INIS)

    Aksenov, V.L.; Nikitenko, Yu.V.; Kozhevnikov, S.V.; Radu, F.; Kruijs, R.; Rekveldt, M.Th.

    1999-01-01

    The regime of neutron standing waves at reflection of polarized thermal neutrons from the structure glass/Cu (1000 A Angstrom)/Ti (2000 A Angstrom)/Co (60 A Angstrom)/Ti (300 A Angstrom) in a magnetic field directed at an angle to the sample plane is realized. The intensity of neutrons with a particular spin projection on the external magnetic field direction appears to be a periodic function of the neutron wavelength and the glancing angle of the reflected beam. It is shown that the neutron standing wave regime can be a very sensitive method for the determination of changes in the spatial position of magnetic noncollinear layers. (author)

  7. Detailed EXOSAT and optical observations of the intermediate polar 3A0729+103: discovery of two medium energy X-ray emission regions

    International Nuclear Information System (INIS)

    McHardy, I.M.; Pye, J.P.; Fairall, A.P.; Menzies, J.W.

    1987-01-01

    EXOSAT observations of the intermediate polar cataclysmic variable 3A0729+103 reveal a strong orbital modulation, with the 2-4KeV X-rays being significantly more modulated than the 4-6keV X-rays, indicative of photoelectric absorption. The 913 second modulation which is very prominent in the optical light curve, is weakly detected in the medium-energy X-ray light curve, confirming that it represents the white dwarf spin period. These observations are well explained by a combination of two sources of medium-energy X-ray emission. The presence of two emission regions is also clearly seen in the optical spectroscopy, particularly in the intensity of the He II4686 line which has two peaks during the orbit. The authors identify the two optical emission regions with the two X-ray emission regions. (author)

  8. Simultaneous analysis of Grazing Incidence X-Ray reflectivity and X-ray standing waves from periodic multilayer systems

    NARCIS (Netherlands)

    Yakunin, S.N.; Makhotkin, Igor Alexandrovich; Chuyev, M.A.; Seregin, A.Y.; Pashayev, E.M.; Louis, Eric; van de Kruijs, Robbert Wilhelmus Elisabeth; Bijkerk, Frederik; Kovalchuk, M.V.

    2012-01-01

    Structural analysis of periodic multilayers with small period thickness (~4 nm) is a challenging task, especially when thicknesses of intermixed interfaces become comparable to individual layer thicknesses. In general, angular dependent X-ray fluorescence measurements, excited by the X-ray standing

  9. Multielement analysis of swiss mice brains with Alzheimer's disease induced by beta amyloid oligomers using a portable total reflection X-ray fluorescence system

    International Nuclear Information System (INIS)

    Almeida, Danielle S.; Brigido, Matheus M.; Anjos, Marcelino J.; Ferreira, Sergio S.; Souza, Amanda S.; Lopes, Ricardo T.

    2017-01-01

    Alzheimer's disease (AD) is a progressive dementia that, in early stages, manifests as a profound inability to form new memories. The pathological features of AD include β-amyloid (Aβ) plaques, intracellular neurofibrillary tangles, loss of neurons and synapses, and activation of glia cells. Recently, several groups have raised the 'metal hypothesis' of AD. Metal ions, such as Cu and Zn, have been demonstrated to modulate amyloid aggregation along different pathways. Extensive research has been conducted on the effects of metals on Aβ aggregation and all of them have shown that both Cu and Zn accelerate the aggregation by shortening, or eliminating, the lag phase associated with the amyloid fibrillation process. The metal ions mentioned previously may have an important impact on the protein misfolding and the progression of the neurodegenerative process. The TXRF technique is very important, because can be used to identify and quantify trace elements present in the sample at very low concentrations (μg.g"-"1). In this work, three groups of females were studied: control, AD10 and AD100. The groups AD10 and AD100 were given a single intracerebroventricular injection of 10 pmol and 100 pmol of oligomers of β-amyloid peptide respectively to be induced AD. The TXRF measurements were performed using a portable total reflection X-ray fluorescence system developed in the Laboratory of Nuclear Instrumentation (LIN/UFRJ) that uses an X-ray tube with a molybdenum anode operating at 40 kV and 500 mA used for the excitation and a detector Si-PIN with energy resolution of 145 eV at 200 eV. It was possible to determine the concentrations of the following elements: P, S, K, Fe, Cu, Zn and Rubidium. Results showed differences in the elemental concentration in some brain regions between the AD groups and the control group. (author)

  10. X-ray resonant magnetic reflectivity of stratified magnetic structures: Eigenwave formalism and application to a W/Fe/W trilayer

    International Nuclear Information System (INIS)

    Elzo, M.; Jal, E.; Bunau, O.; Grenier, S.; Joly, Y.; Ramos, A.Y.; Tolentino, H.C.N.; Tonnerre, J.M.; Jaouen, N.

    2012-01-01

    A formalism for the reflectivity of electromagnetic waves by magnetic materials is presented with an application. It is applied to retrieve the magnetic moment density along the depth of magnetic materials with arbitrary magnetic moment direction using matricial algebra, including roughness between layers. The reflectivity is derived following a classical description with Maxwell equations and a permittivity built from the quantum scattering amplitude. Approximations on the relative power of the Thomson scattering and the magnetic terms are trackable in order to evaluate the validity of the formalism case-by-case, from the optical light regime up to soft and hard X-rays. Eigenwaves are used throughout the whole formalism. In order to illustrate the methodology, we present an application to a W/Fe/W trilayer performed at the Fe L-edge, in the soft X-ray regime. - Highlights: → Magnetism at interfaces and in thin films is increasingly studied. → X-ray resonant magnetic reflectivity yields the in depth magnetization profile in thin films. → We present a formalism and methodology to study the data. → We illustrate the technique with an example.

  11. Investigation of Bragg reflections in α NbDsub(x) under hydrostatic pressure by γ ray diffraction

    International Nuclear Information System (INIS)

    Blaschko, O.; Klemencic, R.; Weinzierl, P.; Eder, O.J.

    1978-01-01

    Bragg reflections of NbDsub(x) single crystals in the α phase were studied under hydrostatic pressure using γ ray diffraction. The integrated intensity of the (211) reflection decreases by - 1.5 +- 0.2%/kbar and - 0.7 +- 0.1%/kbar in NbDsub(0.04) and NbDsub(0.02) respectively. The (200), (110) and (222) reflections show no change of intensity under hydrostatic pressure. In a pure Nb crystal no decrease of the intensity of the (211) reflection was found under hydrostatic pressure. (author)

  12. RefleX: X-ray absorption and reflection in active galactic nuclei for arbitrary geometries

    Science.gov (United States)

    Paltani, S.; Ricci, C.

    2017-11-01

    Reprocessed X-ray radiation carries important information about the structure and physical characteristics of the material surrounding the supermassive black hole (SMBH) in active galactic nuclei (AGN). We report here on a newly developed simulation platform, RefleX, which allows to reproduce absorption and reflection by quasi-arbitrary geometries. We show here the reliability of our approach by comparing the results of our simulations with existing spectral models such as pexrav, MYTorus and BNTorus. RefleX implements both Compton scattering on free electrons and Rayleigh scattering and Compton scattering on bound electrons. We show the effect of bound-electron corrections on a torus geometry simulated like in MYTorus. We release with this paper the RefleX executable, as well as RXTorus, a model that assumes absorption and reflection from a torus with a varying ratio of the minor to major axis of the torus. To allow major flexibility RXTorus is also distributed in three components: absorbed primary emission, scattered radiation and fluorescent lines. RXTorus is provided for different values of the abundance, and with (atomic configuration) or without (free-electron configuration) taking into account Rayleigh scattering and bound electrons. We apply the RXTorus model in both configurations on the XMM-Newton and NuSTAR spectrum of the Compton-thick AGN NGC 424 and find that the models are able to reproduce very well the observations, but that the assumption on the bound or free state of the electrons has significant consequences on the fit parameters. RefleX executable, user manual and example models are available at http://www.astro.unige.ch/reflex. A copy of the RefleX executable is also available at the CDS via anonymous ftp to http://cdsarc.u-strasbg.fr (http://130.79.128.5) or via http://cdsarc.u-strasbg.fr/viz-bin/qcat?J/A+A/607/A31

  13. Characteristics of ionization chambers for intense pulsed x-rays and Co-60 #betta#-rays, (2)

    International Nuclear Information System (INIS)

    Kanazawa, Tamotsu; Okabe, Shigeru; Fukuda, Kyue; Furuta, Junichiro; Fujino, Takahiro

    1981-01-01

    Mean ionization currents and pulse figures of parallel plate ionization chambers enclosed with various gases were measured when they were exposed to intense pulsed X-rays and continuous #betta#-rays. Relation between the measured ionization current and the intensity of X-rays was obtained at the applied voltage of 1000 V. In the case of intense pulsed X-rays, ionization current was smaller in comparison with the case of continuous #betta#-rays, under the X-rays of equal intensity. Pulse figures were observed with chambers which were filled with the gases of air and O 2 and they are considered to be caused by the free electrons of these gases. In these cases, polarity effects of the electric field on the pulse figures were not recognized. Various figures and their changes were also observed from chambers filled with He, Ne, N 2 , Ar, kr, and Xe, respectively. Polarity effects were recognized on those pulse figures. (author)

  14. Energy and polarization dependence of resonant inelastic X-ray scattering in Nd2CuO4

    International Nuclear Information System (INIS)

    Hill, J.P.; Kao, C.C.; Haemaelaeinen, K.

    1998-01-01

    The authors report the energy and polarization dependence of resonant inelastic x-ray scattering from Nd 2 CuO 4 . An energy loss feature at ∼6 eV is observed in the vicinity of the Cu K-edge. Numerical calculations based on the Anderson impurity model identify this as a charge transfer excitation to the anti-bonding state. The incident polarization is shown to select the intermediate states participating in the resonance process. Resonances are observed at 8,990 eV and 9,000 eV with the incident polarization perpendicular and parallel to the CuO planes, respectively. In contrast to the single-site model calculations, no resonances are observed associated with the 1s3d 10 L intermediate states, suggesting non-local effects play a role

  15. Solar X-ray bursts

    International Nuclear Information System (INIS)

    Urnov, A.M.

    1980-01-01

    In the popular form the consideration is given to the modern state tasks and results of X-ray spectrometry of solar bursts. The operation of X-ray spectroheliograph is described. Results of spectral and polarization measurings of X-ray radiation of one powerful solar burst are presented. The conclusion has been drawn that in the process of burst development three characteristic stages may be distingwished: 1) the initial phase; just in this period processes which lead to observed consequences-electromagnetic and corpuscular radiation are born; 2) the impulse phase, or the phase of maximum, is characterised by sharp increase of radiation flux. During this phase the main energy content emanates and some volumes of plasma warm up to high temperatures; 3) the phase of burst damping, during which plasma cools and reverts to the initial condition

  16. The Ferrara hard X-ray facility for testing/calibrating hard X-ray focusing telescopes

    Science.gov (United States)

    Loffredo, Gianluca; Frontera, Filippo; Pellicciotta, Damiano; Pisa, Alessandro; Carassiti, Vito; Chiozzi, Stefano; Evangelisti, Federico; Landi, Luca; Melchiorri, Michele; Squerzanti, Stefano

    2005-12-01

    We will report on the current configuration of the X-ray facility of the University of Ferrara recently used to perform reflectivity tests of mosaic crystals and to calibrate the experiment JEM X aboard Integral. The facility is now located in the technological campus of the University of Ferrara in a new building (named LARIX laboratory= LARge Italian X-ray facility) that includes a tunnel 100 m long with, on the sides, two large experimental rooms. The facility is being improved for determining the optical axis of mosaic crystals in Laue configuration, for calibrating Laue lenses and hard X-ray mirror prototypes.

  17. Magnetic X-ray measurements using the elliptical multipole wiggler

    International Nuclear Information System (INIS)

    Montano, P. A.; Li, Y.; Beno, M. A.; Jennings, G.; Kimball, C. W.

    1999-01-01

    The EMW at the BESSRC beam lines at the APS provides high photon flux at high energies with the capability of producing circular polarization on axis. The authors observe a high degree of circularly polarized x-rays at such energies. The polarization and frequency tunability of the elliptical multipole wiggler (EMW) is an ideal source for many magnetic measurements from X-ray Magnetic Circular Dichroism (XMCD) to Compton scattering experiments. They performed Compton scattering measurements to determine the polarization and photon flux at the sample as a function of the deflection parameters K y and K x . They used for their measurements a Si (220) Laue monochromator providing simultaneous photon energies at 50 keV, 100 keV and 150 keV. Magnetic Compton Profiles were determined by either switching the magnet polarity or the photon helicity. The results obtained using Fe(110) single crystals were very similar

  18. Discovery and development of x-ray diffraction

    Science.gov (United States)

    Jeong, Yeuncheol; Yin, Ming; Datta, Timir

    2013-03-01

    In 1912 Max Laue at University of Munich reasoned x-rays to be short wavelength electromagnetic waves and figured interference would occur when scattered off crystals. Arnold Sommerfeld, W. Wien, Ewald and others, raised objections to Laue's idea, but soon Walter Friedrich succeeded in recording x-ray interference patterns off copper sulfate crystals. But the Laue-Ewald's 3-dimensional formula predicted excess spots. Fewer spots were observed. William Lawrence Bragg then 22 year old studying at Cambridge University heard the Munich results from father William Henry Brag, physics professor at Univ of Leeds. Lawrence figured the spots are 2-d interference of x-ray wavelets reflecting off successive atomic planes and derived a simple eponymous equation, the Bragg equation d*sin(theta) = n*lamda. 1913 onward the Braggs dominated the crystallography. Max Laue was awarded the physics Nobel in 1914 and the Braggs shared the same in 1915. Starting with Rontgen's first ever prize in 1901, the importance of x-ray techniques is evident from the four out of a total 16 physics Nobels between 1901-1917. We will outline the historical back ground and importance of x-ray diffraction giving rise to techniques that even in 2013, remain work horses in laboratories all over the globe.

  19. Combined optic system based on polycapillary X-ray optics and single-bounce monocapillary optics for focusing X-rays from a conventional laboratory X-ray source

    Energy Technology Data Exchange (ETDEWEB)

    Sun, Xuepeng; Liu, Zhiguo [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Sun, Tianxi, E-mail: stx@bnu.edu.cn [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Yi, Longtao; Sun, Weiyuan; Li, Fangzuo; Jiang, Bowen [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China); Ma, Yongzhong [Center for Disease Control and Prevention of Beijing, Beijing 100013 (China); Ding, Xunliang [The Key Laboratory of Beam Technology and Materials Modification of the Ministry of Education, Beijing Normal University, Beijing 100875 (China); College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China); Beijing Radiation Center, Beijing 100875 (China)

    2015-12-01

    Two combined optic systems based on polycapillary X-ray optics and single-bounce monocapillary optics (SBMO) were designed for focusing the X-rays from a conventional laboratory X-ray source. One was based on a polycapillary focusing X-ray lens (PFXRL) and a single-bounce ellipsoidal capillary (SBEC), in which the output focal spot with the size of tens of micrometers of the PFXRL was used as the “virtual” X-ray source for the SBEC. The other system was based on a polycapillary parallel X-ray lens (PPXRL) and a single-bounce parabolic capillary (SBPC), in which the PPXRL transformed the divergent X-ray beam from an X-ray source into a quasi-parallel X-ray beam with the divergence of sever milliradians as the incident illumination of the SBPC. The experiment results showed that the combined optic systems based on PFXRL and SBEC with a Mo rotating anode X-ray generator with the focal spot with a diameter of 300 μm could obtain a focal spot with the total gain of 14,300 and focal spot size of 37.4 μm, and the combined optic systems based on PPXRL and SBPC with the same X-ray source mentioned above could acquire a focal spot with the total gain of 580 and focal spot size of 58.3 μm, respectively. The two combined optic systems have potential applications in micro X-ray diffraction, micro X-ray fluorescence, micro X-ray absorption near edge structure, full field X-ray microscopes and so on.

  20. Synchrotron measurement of the 3D shape of X-ray reflections from the {gamma}/{gamma}{sup '}-microstructure of nickel-base superalloys

    Energy Technology Data Exchange (ETDEWEB)

    Epishin, Alexander; Link, Thomas; Ulbricht, Alexander; Bansal, Mamta [Technical Univ. of Berlin (Germany). Inst. of Material Science and Technology; Zizak, Ivo [Helmholtz-Zentrum Berlin for Materials and Energy BESSY II, Berlin (Germany)

    2011-12-15

    The 3D shape of X-ray reflections from the {gamma}/{gamma}{sup '}-microstructure of a nickel-base superalloy was investigated using synchrotron X-ray radiation and a position sensitive area detector. The measurements were performed on the 4{sup th} generation single-crystal nickel-base superalloy TMS138. The results show that X-ray reflections from non-cubic crystallographic planes have a complex 3D shape which changes during rafting. The 3D intensity distributions contain information about the spacing of the planes and their orientation as well. Whereas h00 reflections show the usual splitting into a {gamma}{sup '} and one {gamma}-subreflection, the hh0 and hhh reflections show two and three {gamma}-peaks respectively, resulting from the different types of {l_brace}100{r_brace} matrix channels. Therefore, these 3D diffraction measurements supply additional information about the spatial distribution of microstrains. (orig.)

  1. Investigation of the near-surface structures of polar InN films by chemical-state-discriminated hard X-ray photoelectron diffraction

    International Nuclear Information System (INIS)

    Yang, A. L.; Yamashita, Y.; Kobata, M.; Yoshikawa, H.; Sakata, O.; Kobayashi, K.; Matsushita, T.; Píš, I.; Imura, M.; Yamaguchi, T.; Nanishi, Y.

    2013-01-01

    Near-surface structures of polar InN films were investigated by laboratory-based hard X-ray photoelectron diffraction (HXPD) with chemical-state-discrimination. HXPD patterns from In 3d 5/2 and N 1s core levels of the In-polar and N-polar InN films were different from each other and compared with the simulation results using a multiple-scattering cluster model. It was found that the near-surface structure of the In-polar InN film was close to the ideal wurtzite structure. On the other hand, on the N-polar InN film, defects-rich surface was formed. In addition, the existence of the In-polar domains was observed in the HXPD patterns.

  2. Deducing Electron Properties from Hard X-Ray Observations

    Science.gov (United States)

    Kontar, E. P.; Brown, J. C.; Emslie, A. G.; Hajdas, W.; Holman, G. D.; Hurford, G. J.; Kasparova, J.; Mallik, P. C. V.; Massone, A. M.; McConnell, M. L.; hide

    2011-01-01

    X-radiation from energetic electrons is the prime diagnostic of flare-accelerated electrons. The observed X-ray flux (and polarization state) is fundamentally a convolution of the cross-section for the hard X-ray emission process(es) in question with the electron distribution function, which is in turn a function of energy, direction, spatial location and time. To address the problems of particle propagation and acceleration one needs to infer as much information as possible on this electron distribution function, through a deconvolution of this fundamental relationship. This review presents recent progress toward this goal using spectroscopic, imaging and polarization measurements, primarily from the Reuven Ramaty High Energy Solar Spectroscopic Imager (RHESSI). Previous conclusions regarding the energy, angular (pitch angle) and spatial distributions of energetic electrons in solar flares are critically reviewed. We discuss the role and the observational evidence of several radiation processes: free-free electron-ion, free-free electron-electron, free-bound electron-ion, photoelectric absorption and Compton backscatter (albedo), using both spectroscopic and imaging techniques. This unprecedented quality of data allows for the first time inference of the angular distributions of the X-ray-emitting electrons and improved model-independent inference of electron energy spectra and emission measures of thermal plasma. Moreover, imaging spectroscopy has revealed hitherto unknown details of solar flare morphology and detailed spectroscopy of coronal, footpoint and extended sources in flaring regions. Additional attempts to measure hard X-ray polarization were not sufficient to put constraints on the degree of anisotropy of electrons, but point to the importance of obtaining good quality polarization data in the future.

  3. Design of a normal incidence multilayer imaging X-ray microscope

    Science.gov (United States)

    Shealy, David L.; Gabardi, David R.; Hoover, Richard B.; Walker, Arthur B. C., Jr.; Lindblom, Joakim F.

    Normal incidence multilayer Cassegrain X-ray telescopes were flown on the Stanford/MSFC Rocket X-ray Spectroheliograph. These instruments produced high spatial resolution images of the sun and conclusively demonstrated that doubly reflecting multilayer X-ray optical systems are feasible. The images indicated that aplanatic imaging soft X-ray/EUV microscopes should be achievable using multilayer optics technology. A doubly reflecting normal incidence multilayer imaging X-ray microscope based on the Schwarzschild configuration has been designed. The design of the microscope and the results of the optical system ray trace analysis are discussed. High resolution aplanatic imaging X-ray microscopes using normal incidence multilayer X-ray mirrors should have many important applications in advanced X-ray astronomical instrumentation, X-ray lithography, biological, biomedical, metallurgical, and laser fusion research.

  4. Anisotropic ray trace

    Science.gov (United States)

    Lam, Wai Sze Tiffany

    anisotropic ray tracing. x. Chapter 4 presents the data reduction of the P matrix of a crystal waveplate. The diattenuation is embedded in the singular values of P. The retardance is divided into two parts: (A) The physical retardance induced by OPLs and surface interactions, and (B) the geometrical transformation induced by geometry of a ray path, which is calculated by the geometrical transform Q matrix. The Q matrix of an anisotropic intercept is derived from the generalization of s- and p-bases at the anisotropic intercept; the p basis is not confined to the plane of incidence due to the anisotropic refraction or reflection. Chapter 5 shows how the multiple P matrices associated with the eigenmodes resulting from propagation through multiple anisotropic surfaces can be combined into one P matrix when the multiple modes interfere in their overlapping regions. The resultant P matrix contains diattenuation induced at each surface interaction as well as the retardance due to ray propagation and total internal reflections. The polarization aberrations of crystal waveplates and crystal polarizers are studied in Chapter 6 and Chapter 7. A wavefront simulated by a grid of rays is traced through the anisotropic system and the resultant grid of rays is analyzed. The analysis is complicated by the ray doubling effects and the partially overlapping eigen-wavefronts propagating in various directions. The wavefront and polarization aberrations of each eigenmode can be evaluated from the electric field distributions. The overall polarization at the plane of interest or the image quality at the image plane are affected by each of these eigen-wavefronts. Isotropic materials become anisotropic due to stress, strain, or applied electric or magnetic fields. In Chapter 8, the P matrix for anisotropic materials is extended to ray tracing in stress birefringent materials which are treated as spatially varying anisotropic materials. Such simulations can predict the spatial retardance variation

  5. Numerical controlled diamond fly cutting machine for grazing incidence X-ray reflection mirrors

    International Nuclear Information System (INIS)

    Uchida, Fumihiko; Moriyama, Shigeo; Seya, Eiiti

    1992-01-01

    Synchrotron radiation has reached the stage of practical use, and the application to the wide fields that support future advanced technologies such as spectroscopy, the structural analysis of matters, semiconductor lithography and medical light source is expected. For the optical system of the equipment utilizing synchrotron radiation, the total reflection mirrors of oblique incidence are used for collimating and collecting X-ray. In order to restrain their optical aberration, nonspherical shape is required, and as the manufacturing method with high precision for nonspherical mirrors, a numerically controlled diamond cutting machine was developed. As for the cutting of soft metals with diamond tools, the high precision machining of any form can be done by numerical control, the machining time can be reduced as compared with grinding, and the cooling effect is large in metals. The construction of the cutting machine, the principle of machining, the control system, the method of calculating numerical control data, the investigation of machinable forms and the result of evaluation are reported. (K.I.)

  6. A high-density relativistic reflection origin for the soft and hard X-ray excess emission from Mrk 1044

    Science.gov (United States)

    Mallick, L.; Alston, W. N.; Parker, M. L.; Fabian, A. C.; Pinto, C.; Dewangan, G. C.; Markowitz, A.; Gandhi, P.; Kembhavi, A. K.; Misra, R.

    2018-06-01

    We present the first results from a detailed spectral-timing analysis of a long (˜130 ks) XMM-Newton observation and quasi-simultaneous NuSTAR and Swift observations of the highly-accreting narrow-line Seyfert 1 galaxy Mrk 1044. The broadband (0.3-50 keV) spectrum reveals the presence of a strong soft X-ray excess emission below ˜1.5 keV, iron Kα emission complex at ˜6 -7 keV and a `Compton hump' at ˜15 -30 keV. We find that the relativistic reflection from a high-density accretion disc with a broken power-law emissivity profile can simultaneously explain the soft X-ray excess, highly ionized broad iron line and the Compton hump. At low frequencies ([2 - 6] × 10-5 Hz), the power-law continuum dominated 1.5-5 keV band lags behind the reflection dominated 0.3-1 keV band, which is explained with a combination of propagation fluctuation and Comptonization processes, while at higher frequencies ([1 - 2] × 10-4 Hz), we detect a soft lag which is interpreted as a signature of X-ray reverberation from the accretion disc. The fractional root-mean-squared (rms) variability of the source decreases with energy and is well described by two variable components: a less variable relativistic disc reflection and a more variable direct coronal emission. Our combined spectral-timing analyses suggest that the observed broadband X-ray variability of Mrk 1044 is mainly driven by variations in the location or geometry of the optically thin, hot corona.

  7. The Imaging X-Ray Polarimetry Explorer (IXPE)

    Science.gov (United States)

    Weisskopf, Martin C.; Ramsey, Brian; O’Dell, Stephen; Tennant, Allyn; Elsner, Ronald; Soffita, Paolo; Bellazzini, Ronaldo; Costa, Enrico; Kolodziejczak, Jeffery; Kaspi, Victoria; hide

    2016-01-01

    The Imaging X-ray Polarimetry Explorer (IXPE) is an exciting international collaboration for a scientific mission that dramatically brings together the unique talents of the partners to expand observation space by simultaneously adding polarization measurements to the array of source properties currently measured (energy, time, and location). IXPE uniquely brings to the table polarimetric imaging. IXPE will thus open new dimensions for understanding how X-ray emission is produced in astrophysical objects, especially systems under extreme physical conditions-such as neutron stars and black holes. Polarization singularly probes physical anisotropies-ordered magnetic fields, aspheric matter distributions, or general relativistic coupling to black-hole spin-that are not otherwise measurable. Hence, IXPE complements all other investigations in high-energy astrophysics by adding important and relatively unexplored information to the parameter space for studying cosmic X-ray sources and processes, as well as for using extreme astrophysical environments as laboratories for fundamental physics.

  8. NUSTAR and Suzaku x-ray spectroscopy of NGC 4151: Evidence for reflection from the inner accretion disk

    Energy Technology Data Exchange (ETDEWEB)

    Keck, M. L.; Brenneman, L. W.; Ballantyne, D. R.; Bauer, F.; Boggs, S. E.; Christensen, F. E.; Craig, W. W.; Dauser, T.; Elvis, M.; Fabian, A. C.; Fuerst, F.; García, J.; Grefenstette, B. W.; Hailey, C. J.; Harrison, F. A.; Madejski, G.; Marinucci, A.; Matt, G.; Reynolds, C. S.; Stern, D.; Walton, D. J.; Zoghbi, A.

    2015-06-15

    We present X-ray timing and spectral analyses of simultaneous 150 ks Nuclear Spectroscopic Telescope Array (NuSTAR) and Suzaku X-ray observations of the Seyfert 1.5 galaxy NGC 4151. We disentangle the continuum emission, absorption, and reflection properties of the active galactic nucleus (AGN) by applying inner accretion disk reflection and absorption-dominated models. With a time-averaged spectral analysis, we find strong evidence for relativistic reflection from the inner accretion disk. We find that relativistic emission arises from a highly ionized inner accretion disk with a steep emissivity profile, which suggests an intense, compact illuminating source. We find a preliminary, near-maximal black hole spin $a\\gt 0.9$ accounting for statistical and systematic modeling errors. We find a relatively moderate reflection fraction with respect to predictions for the lamp post geometry, in which the illuminating corona is modeled as a point source. Through a time-resolved spectral analysis, we find that modest coronal and inner disk reflection (IDR) flux variation drives the spectral variability during the observations. We discuss various physical scenarios for the IDR model and we find that a compact corona is consistent with the observed features.

  9. Magnetic X-Ray Scattering with Synchrotron Radiation

    DEFF Research Database (Denmark)

    Moncton, D. E.; Gibbs, D.; Bohr, Jakob

    1986-01-01

    With the availability of high-brilliance synchrotron radiation from multiple wigglers, magnetic X-ray scattering has become a powerful new probe of magnetic structure and phase transitions. Similar to the well-established magnetic neutron scattering technique, magnetic X-ray scattering methods have...... many complementary advantages. A brief review is presented of the history of magnetic X-ray scattering as well as recent results obtained in studies of the rare-earth magnet holmium with emphasis on instrumentational aspects. In particular, the development of a simple polarization analyzer...... to distinguish charge and magnetic scattering is described....

  10. X-ray metrology for ULSI structures

    International Nuclear Information System (INIS)

    Bowen, D. K.; Matney, K. M.; Wormington, M.

    1998-01-01

    Non-destructive X-ray metrological methods are discussed for application to both process development and process control of ULSI structures. X-ray methods can (a) detect the unacceptable levels of internal defects generated by RTA processes in large wafers, (b) accurately measure the thickness and roughness of layers between 1 and 1000 nm thick and (c) can monitor parameters such as crystallographic texture and the roughness of buried interfaces. In this paper we review transmission X-ray topography, thin film texture measurement, grazing-incidence X-ray reflectivity and high-resolution X-ray diffraction. We discuss in particular their suitability as on-line sensors for process control

  11. X-ray diffraction and X-ray standing-wave study of the lead stearate film structure

    Energy Technology Data Exchange (ETDEWEB)

    Blagov, A. E.; Dyakova, Yu. A.; Kovalchuk, M. V.; Kohn, V. G.; Marchenkova, M. A.; Pisarevskiy, Yu. V.; Prosekov, P. A., E-mail: prosekov@crys.ras.ru [Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

    2016-05-15

    A new approach to the study of the structural quality of crystals is proposed. It is based on the use of X-ray standing-wave method without measuring secondary processes and considers the multiwave interaction of diffraction reflections corresponding to different harmonics of the same crystallographic reflection. A theory of multiwave X-ray diffraction is developed to calculate the rocking curves in the X-ray diffraction scheme under consideration for a long-period quasi-one-dimensional crystal. This phase-sensitive method is used to study the structure of a multilayer lead stearate film on a silicon substrate. Some specific structural features are revealed for the surface layer of the thin film, which are most likely due to the tilt of the upper layer molecules with respect to the external normal to the film surface.

  12. X-Ray Study of Variable Gamma-Ray Pulsar PSR J2021+4026

    Science.gov (United States)

    Wang, H. H.; Takata, J.; Hu, C.-P.; Lin, L. C. C.; Zhao, J.

    2018-04-01

    PSR J2021+4026 showed a sudden decrease in the gamma-ray emission at the glitch that occurred around 2011 October 16, and a relaxation of the flux to the pre-glitch state at around 2014 December. We report X-ray analysis results of the data observed by XMM-Newton on 2015 December 20 in the post-relaxation state. To examine any change in the X-ray emission, we compare the properties of the pulse profiles and spectra at the low gamma-ray flux state and at the post-relaxation state. The phase-averaged spectra for both states can be well described by a power-law component plus a blackbody component. The former is dominated by unpulsed emission and probably originated from the pulsar wind nebula as reported by Hui et al. The emission property of the blackbody component is consistent with the emission from the polar cap heated by the back-flow bombardment of the high-energy electrons or positrons that were accelerated in the magnetosphere. We found no significant change in the X-ray emission properties between two states. We suggest that the change of the X-ray luminosity is at an order of ∼4%, which is difficult to measure with the current observations. We model the observed X-ray light curve with the heated polar cap emission, and we speculate that the observed large pulsed fraction is owing to asymmetric magnetospheric structure.

  13. X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

    International Nuclear Information System (INIS)

    Denbeaux, G.; Anderson, E.; Bates, B.; Chao, W.; Liddle, J.A.; Harteneck, B.; Pearson, A.; Salmassi, F.; Schneider, G.; Fischer, P.; Eimuller, T.; Taylor, S.; Chang, H.; Kusinski, G.J.

    2002-01-01

    Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope. (authors)

  14. Epoxy replication for Wolter x-ray microscope fabrication

    International Nuclear Information System (INIS)

    Priedhorsky, W.

    1981-01-01

    An epoxy replica of a test piece designed to simulate a Wolter x-ray microscope geometry showed no loss of x-ray reflectivity or resolution, compared to the original. The test piece was a diamond-turned cone with 1.5 0 half angle. A flat was fly-cut on one side, then super- and conventionally polished. The replica was separated at the 1.5 0 -draft angle, simulating a shallow angle Wolter microscope geometry. A test with 8.34 A x rays at 0.9 0 grazing angle showed a reflectivity of 67% for the replica flat surface, and 70% for the original. No spread of the reflected beam was observed with a 20-arc second wide test beam. This test verifies the epoxy replication technique for production of Wolter x-ray microscopes

  15. Identification of inversion domains in KTiOPO{sub 4}via resonant X-ray diffraction

    Energy Technology Data Exchange (ETDEWEB)

    Fabrizi, Federica, E-mail: federica.fabrizi@diamond.ac.uk [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom); Thomas, Pamela A. [Department of Physics, University of Warwick, Coventry, CV4 7AL (United Kingdom); Nisbet, Gareth; Collins, Stephen P. [Diamond Light Source, Harwell Science and Innovation Campus, Didcot, OX11 0DE (United Kingdom)

    2015-05-14

    The identification and high-resolution mapping of the absolute crystallographic structure in multi-domain ferroelectric KTiOPO{sub 4} is achieved through a novel synchrotron X-ray diffraction method. On a single Bragg reflection, the intensity ratio in resonant diffraction below and above the Ti absorption K edge demonstrates a domain contrast up to a factor of ∼270, thus implementing a non-contact, non-destructive imaging technique with micrometre spatial resolution, applicable to samples of arbitrarily large dimensions. A novel method is presented for the identification of the absolute crystallographic structure in multi-domain polar materials such as ferroelectric KTiOPO{sub 4}. Resonant (or ‘anomalous’) X-ray diffraction spectra collected across the absorption K edge of Ti (4.966 keV) on a single Bragg reflection demonstrate a huge intensity ratio above and below the edge, providing a polar domain contrast of ∼270. This allows one to map the spatial domain distribution in a periodically inverted sample, with a resolution of ∼1 µm achieved with a microfocused beam. This non-contact, non-destructive technique is well suited for samples of large dimensions (in contrast with traditional resonant X-ray methods based on diffraction from Friedel pairs), and its potential is particularly relevant in the context of physical phenomena connected with an absence of inversion symmetry, which require characterization of the underlying absolute atomic structure (such as in the case of magnetoelectric coupling and multiferroics)

  16. Flat-response x-ray-diode-detector development

    International Nuclear Information System (INIS)

    Tirsell, G.

    1982-10-01

    In this report we discuss the design of an improved sub-nanosecond flat response x-ray diode detector needed for ICF diagnostics. This device consists of a high Z cathode and a complex filter tailored to flatten the response so that the total x-ray energy below 1.5 keV can be measured using a single detector. Three major problems have become evident as a result of our work with the original LLNL design including deviation from flatness due to a peak in the response below 200 eV, saturation at relatively low x-ray fluences, and long term gold cathode instability. We are investigating grazing incidence reflection to reduce the response below 200 eV, new high Z cathode materials for long term stability, and a new complex filter for improved flatness. Better saturation performance will require a modified XRD detector under development with reduced anode to cathode spacing and increased anode bias voltage

  17. X-ray generation by femtosecond laser pulses and its application to soft X-ray imaging microscope

    International Nuclear Information System (INIS)

    Ikeda, Kenichi; Kotaki, Hideyuki; Nakajima, Kazuhisa

    2002-01-01

    We have developed laser-produced plasma X-ray sources using femtosecond laser pulses at 10Hz repetition rate in a table-top size in order to investigate basic mechanism of X-ray emission from laser-matter interactions and its application to a X-ray microscope. In a soft X-ray region over 5 nm wavelength, laser-plasma X-ray emission from a solid target achieved an intense flux of photons of the order of 1011 photons/rad per pulse with duration of a few 100 ps, which is intense enough to make a clear imaging in a short time exposure. As an application of laser-produced plasma X-ray source, we have developed a soft X-ray imaging microscope operating in the wavelength range around 14 nm. The microscope consists of a cylindrically ellipsoidal condenser mirror and a Schwarzshird objective mirror with highly-reflective multilayers. We report preliminary results of performance tests of the soft X-ray imaging microscope with a compact laser-produced plasma X-ray source

  18. Guiding hard x rays with glass polycapillary fiber

    International Nuclear Information System (INIS)

    Xiao, Q.F.; Ponomarev, I.Y.; Kolomitsev, A.I.; Gibson, D.M.; Dilmanian, F.A.; Nachaliel, E.

    1993-01-01

    X rays can be guided through a polycapillary fiber by multiple total reflections from the smooth channel walls of the fiber. Using monochromatic Synchrotron Radiation at energies of 22 and 44 keV, we measured the efficiency of transmission of x rays through polycapillary fibers with channel diameters of about 13 μm. Efficiencies of 57.3% and 54.5% for 22 keV and 44 keV x rays, respectively, were obtained with a 120-mm-long straight polycapillary fiber aligned with the incident beam. These values are close to the open fraction of the fiber, which is about 60%. In addition, transmission efficiency was measured as a function of the tilt angle between the incident beam and the axis of the fiber. We also measured the transmission efficiency as a function of the deflection angle for a 114-mm-long curved polycapillary fiber. The measurements are compared with a ray-tracing simulation

  19. K-edge x-ray dichroism investigation of Fe1−xCoxSi: Experimental evidence for spin polarization crossover

    International Nuclear Information System (INIS)

    Hearne, G.R.; Diguet, G.; Baudelet, F.; Itié, J.-P.; Manyala, N.

    2015-01-01

    Both Fe and Co K-edge x-ray magnetic circular dichroism (XMCD) have been employed as element-specific probes of the magnetic moments in the composition series of the disordered ferromagnet Fe 1−x Co x Si (for x=0.2, 0.3, 0.4, 0.5). A definitive single peaked XMCD profile occurs for all compositions at both Fe and Co K-edges. The Fe 4p orbital moment, deduced from the integral of the XMCD signal, has a steep dependence on x at low doping levels and evolves to a different (weaker) dependence at x≥0.3, similar to the behavior of the magnetization in the Co composition range studied here. It is systematically higher, by at least a factor of two, than the corresponding Co orbital moment for most of the composition series. Fine structure beyond the K-edge absorption (limited range EXAFS) suggests that the local order (atomic environment) is very similar across the series, from the perspective of both the Fe and Co absorbing atom. The variation in the XMCD integral across the Co composition range has two regimes, that which occurs below x=0.3 and then evolves to different behavior at higher doping levels. This is more conspicuously present in the Fe contribution. This is rationalized as the evolution from a half-metallic ferromagnet at low Co doping to that of a strong ferromagnet at x>0.3 and as such, spin polarization crossover occurs. The Fermi level is tuned from the majority spin band for x<0.3 where a strongly polarized majority spin electron gas prevails, to a regime where minority spin carriers dominate at higher doping. The evolution of the Fe-derived spin polarized (3d) bands, indirectly probed here via the 4p states, is the primary determinant of the doping dependence of the magnetism in this alloy series. - Highlights: • Element-specific probing of the electronic structure of the Fe 1−x Co x Si series. • XMCD at the level of 10 −4 at the K-edge in such low-moment systems. • Element-specific probing of magnetic contributions from both Fe and Co

  20. X-ray fluorescence analysis of thin films at glancing-incident and -takeoff angles

    International Nuclear Information System (INIS)

    Tsuji, K.; Sato, S.; Hirokawa, K.

    1995-01-01

    We have developed a new analytical method, Glancing-Incidence and -Takeoff X-Ray Fluorescence (GIT-XRF) method for the first time. Here, we present an idea for a thin-film analysis and a surface analysis by the GIT-XRF method. In this method, the dependence of the fluorescent x-ray intensity on takeoff angle is measured at various incident angles of the primary x-ray. Compared with a total reflection x-ray fluorescence method, the GIT-XRF method allows a detailed thin-film analysis, because the thin film is cross-checked by many experimental curves. Moreover, a surface-sensitive analysis is also possible by the GIT-XRF method. (author)

  1. Mineral elements and essential trace elements in blood of seals of the North Sea measured by total-reflection X-ray fluorescence analysis

    International Nuclear Information System (INIS)

    Griesel, S.; Mundry, R.; Kakuschke, A.; Fonfara, S.; Siebert, U.; Prange, A.

    2006-01-01

    Mineral and essential trace elements are involved in numerous physiological processes in mammals. Often, diseases are associated with an imbalance of the electrolyte homeostasis. In this study, the concentrations of mineral elements (P, S, K, Ca) and essential trace elements (Fe, Cu, Zn, Se, Rb, Sr) in whole blood of harbor seals (Phoca vitulina) were determined using total-reflection X-ray fluorescence spectrometry (TXRF). Samples from 81 free-ranging harbor seals from the North Sea and two captive seals were collected during 2003-2005. Reference ranges and element correlations for health status determination were derived for P, S, K, Ca, Fe, Cu, and Zn level in whole blood. Grouping the seals by age, gender and sample location the concentration levels of the elements were compared. The blood from two captive seals with signs of diseases and four free-ranging seals showed reduced element levels of P, S, and Ca and differences in element correlation of electrolytes were ascertained. Thus, simultaneous measurements of several elements in only 500 μL volumes of whole blood provide the possibility to obtain information on both, the electrolyte balance and the hydration status of the seals. The method could therefore serve as an additional biomonitoring tool for the health assessment

  2. Total reflection X-ray fluorescence measurements of S and P in proteins using a vacuum chamber specially designed for low Z elements

    International Nuclear Information System (INIS)

    Rauwolf, M.; Vanhoof, C.; Tirez, K.; Maes, E.; Ingerle, D.; Wobrauschek, P.; Streli, C.

    2014-01-01

    As the ratio of phosphorus and sulfur in proteins allows the determination of the phosphorylation degree in proteins, the absolute determination of phosphorus and sulfur in organic samples is of growing interest. While it takes some effort to quantify phosphorus and sulfur with inductively coupled quadrupole plasma mass spectrometry (ICP-QMS), total reflection X-ray fluorescence analysis (TXRF) allows easy quantification. In the presented work, the low Z TXRF spectrometer at the Atominstitut was used to analyze phosphorus and sulfur in proteins. Although the preparation of the protein samples proved to be more difficult than originally expected, it could be shown that TXRF is well suited for the determination of P and S in proteins. The obtained lower limits of detection (LLD) for P and S in proteins were extrapolated for 1000s and were 34 pg and 19 pg, respectively. The importance of height scans for each sample to exclude heterogeneities was demonstrated. - Highlights: • Low Z TXRF spectrometry was used to analyze phosphorus and sulfur in proteins. • TXRF is well suited for the determination of P and S in proteins. • Good detection limits for P (34 pg) and S (19 pg) were achieved. • Due to the detection limits, we propose that TXRF is a suitable method to analyze protein fractions

  3. Correlating properties and microstructure of YBCO thin films by magnetic X-ray microscopy

    Energy Technology Data Exchange (ETDEWEB)

    Ruoss, Stephen; Stahl, Claudia; Weigand, Markus; Schuetz, Gisela [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Zahn, Patrick; Bayer, Jonas [Max-Planck-Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart (Germany); Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany); Albrecht, Joachim [Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstrasse 1, 73430 Aalen (Germany)

    2016-07-01

    The magnetic flux distribution in high-temperature superconductors namely YBCO has been observed using a novel high-resolution technique based on the X-ray magnetic circular dichroism (XMCD). Therefore, a CoFeB layer is deposited on the superconductor which exhibits a strong XMCD-effect. X-ray absorption measurements with circular polarized radiation allows the analysis of the magnetic flux distribution in the superconductor via the soft-magnetic sensor layer [3,4]. In the total electron yield (TEY) mode of the scanning X-ray microscope (SXM) the surface structure and the magnetic domains can be imaged at the same time. Having obtained such high resolution images, the correlation of magnetic flux penetration and defect structure of YBCO thin films can be analyzed. The measurements have been performed at the scanning X-ray microscope MAXYMUS at Bessy II, HZB Berlin.

  4. X and gamma ray backgroud observations in Antarctic

    International Nuclear Information System (INIS)

    Jayanthi, U.B.

    1988-01-01

    Atmospheric X amd gamma rays are products of complex electromagnetic interation between charged particles and atmospheric constituents. The latitudinal dependence of the cosmic rays secondaries, auroral and South Atlantic Anomaly phenomena produce flux variations, especially the later temporal flux variations. We propose to discuss these variations in relevance to balloon flight observations of X and gamma ray atmospheric background at polar latitudes. (author) [pt

  5. Synchrotron radiation total reflection for rainwater analysis

    International Nuclear Information System (INIS)

    Simabuco, Silvana M.; Matsumoto, Edson

    1999-01-01

    Total reflection X-ray fluorescence analysis excited with synchrotron radiation (SR-TXRF) has been used for rainwater trace element analysis. The samples were collected in four different sites at Campinas City, SP. Standard solutions with gallium as internal standard were prepared for the calibration system. Rainwater samples of 10 μl were putted onto Perspex reflector disk, dried on vacuum and analyzed for 100 s measuring time. The detection limits obtained for K-shell varied from 29 ng.ml -1 for sulfur to 1.3 ng.ml -1 for zinc and copper, while for L-shell the values were 4.5 ng.ml -1 for mercury and 7.0 ng.ml -1 for lead. (author)

  6. Polarized vacuum ultraviolet and X-radiation

    International Nuclear Information System (INIS)

    Samson, J.A.R.

    1978-01-01

    The most intense source of polarized vacuum UV and X-radiation is synchrotron radiation, which exhibits a degree of partially polarized light between about 80-100%. However, the radiation transmitted by vacuum UV monochromators can also be highly polarized. The Seya-Namioka type of monochromator can produce partially polarized radiation between 50-80%. For certain experiments it is necessary to know the degree of polarisation of the radiation being used. Also, when synchrotron radiation and a monochromator are combined the polarization characteristic of both should be known in order to make full use of these polarization properties. The polarizing effect on monochromators (i.e. diffraction gratings) have been measured at the Seya angle and at grazing angles for various spectral orders. The author presents the first experimental evidence that the reciprocity law holds for polarization by reflection where the angle of incidence and diffraction are unequal. These results are reviewed along with the techniques for measuring the degree of polarization. (Auth.)

  7. The X-Ray Reflection Spectrum of the Radio-Loud Quasar 4C 74.26

    Science.gov (United States)

    Lohfink, Ann M.; Fabian, Andrew C.; Ballantyne, David R.; Boggs, S. E.; Boorman, Peter; Christensen, F. E.; Craig, W. W.; Farrah, Duncan; Garcia, Javier; Hailey, C. J.; hide

    2017-01-01

    The relativistic jets created by some active galactic nuclei are important agents of AGN feedback. In spite of this, our understanding of what produces these jets is still incomplete. X-ray observations, which can probe the processes operating in the central regions in the immediate vicinity of the supermassive black hole, the presumed jet launching point, are potentially particularly valuable in illuminating the jet formation process. Here, we present the hard X-ray NuSTAR observations of the radio-loud quasar 4C 74.26 in a joint analysis with quasi-simultaneous, soft X-ray Swift observations. Our spectral analysis reveals a high-energy cutoff of -183+3551 keV and confirms the presence of ionized reflection in the source. From the average spectrum we detect that the accretion disk is mildly recessed, with an inner radius of Rin4180 Rg. However, no significant evolution of the inner radius is seen during the three months covered by our NuSTAR campaign. This lack of variation could mean that the jet formation in this radio-loud quasar differs from what is observed in broad-line radio galaxies.

  8. X-ray data processing

    OpenAIRE

    Powell, Harold R.

    2017-01-01

    The method of molecular structure determination by X-ray crystallography is a little over a century old. The history is described briefly, along with developments in X-ray sources and detectors. The fundamental processes involved in measuring diffraction patterns on area detectors, i.e. autoindexing, refining crystal and detector parameters, integrating the reflections themselves and putting the resultant measurements on to a common scale are discussed, with particular reference to the most c...

  9. X-ray microfocusing with off-axis ellipsoidal mirror

    Energy Technology Data Exchange (ETDEWEB)

    Yumoto, Hirokatsu, E-mail: yumoto@spring8.or.jp; Koyama, Takahisa [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); Matsuyama, Satoshi; Yamauchi, Kazuto [Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan); Kohmura, Yoshiki; Ishikawa, Tetsuya [RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan); Ohashi, Haruhiko [Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan); RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)

    2016-07-27

    High-precision ellipsoidal mirrors for two-dimensionally focusing X-rays to nanometer sizes have not been realized because of technical problems in their fabrication processes. The objective of the present study is to develop fabrication techniques for ellipsoidal focusing mirrors in the hard-X-ray region. We design an off-axis ellipsoidal mirror for use under total reflection conditions up to the X-ray energy of 8 keV. We fabricate an ellipsoidal mirror with a surface roughness of 0.3 nm RMS (root-mean-square) and a surface figure error height of 3.0 nm RMS by utilizing a surface profiler and surface finishing method developed by us. The focusing properties of the mirror are evaluated at the BL29XUL beamline in SPring-8. A focusing beam size of 270 nm × 360 nm FWHM (full width at half maximum) at an X-ray energy of 7 keV is observed with the use of the knife-edge scanning method. We expect to apply the developed fabrication techniques to construct ellipsoidal nanofocusing mirrors.

  10. TESTING MODELS FOR THE SHALLOW DECAY PHASE OF GAMMA-RAY BURST AFTERGLOWS WITH POLARIZATION OBSERVATIONS

    Energy Technology Data Exchange (ETDEWEB)

    Lan, Mi-Xiang; Dai, Zi-Gao [School of Astronomy and Space Science, Nanjing University, Nanjing 210093 (China); Wu, Xue-Feng, E-mail: dzg@nju.edu.cn [Purple Mountain Observatory, Chinese Academy of Sciences, Nanjing 210008 (China)

    2016-08-01

    The X-ray afterglows of almost one-half of gamma-ray bursts have been discovered by the Swift satellite to have a shallow decay phase of which the origin remains mysterious. Two main models have been proposed to explain this phase: relativistic wind bubbles (RWBs) and structured ejecta, which could originate from millisecond magnetars and rapidly rotating black holes, respectively. Based on these models, we investigate polarization evolution in the shallow decay phase of X-ray and optical afterglows. We find that in the RWB model, a significant bump of the polarization degree evolution curve appears during the shallow decay phase of both optical and X-ray afterglows, while the polarization position angle abruptly changes its direction by 90°. In the structured ejecta model, however, the polarization degree does not evolve significantly during the shallow decay phase of afterglows whether the magnetic field configuration in the ejecta is random or globally large-scale. Therefore, we conclude that these two models for the shallow decay phase and relevant central engines would be testable with future polarization observations.

  11. Line Emission and X-ray Line Polarization of Multiply Ionized Mo Ions

    Science.gov (United States)

    Petkov, E. E.; Safronova, A. S.; Kantsyrev, V. L.; Shlyaptseva, V. V.; Stafford, A.; Safronova, U. I.; Shrestha, I. K.; Schultz, K. A.; Childers, R.; Cooper, M. C.; Beiersdorfer, P.; Hell, N.; Brown, G. V.

    2016-10-01

    We present a comprehensive experimental and theoretical study of the line emission from multiply ionized Mo ions produced by two different sets of experiments: at LLNL EBIT and the pulsed power generator Zebra at UNR. Mo line emission and polarization measurements were accomplished at EBIT for the first time. In particular, benchmarking experiments at the LLNL EBIT with Mo ions produced at electron beam energies from 2.75 keV up to 15 keV allowed us to break down these very complicated spectra into spectra with only few ionization stages and to select processes that influence them as well as to measure line polarization. The EBIT data were recorded using the EBIT Calorimeter Spectrometer and a crystal spectrometer with a Ge crystal. X-ray Mo spectra and pinhole images were collected from Z-pinch plasmas produced from various wire loads. Non-LTE modeling, high-precision relativistic atomic and polarization data were used to analyze L-shell Mo spectra. The influence of different plasma processes including electron beams on Mo line radiation is summarized. This work was supported by NNSA under DOE Grant DE-NA0002954. Experiments at the NTF/UNR were funded in part by DE-NA0002075. Work at LLNL was performed under the auspices of the U.S. DOE under contract DE-AC52-07NA27344.

  12. Layered magnets: polarized neutron reflection studies

    Energy Technology Data Exchange (ETDEWEB)

    Zabel, H; Schreyer, A [Ruhr-Univ. Bochum, Lehrstuhl fuer Experimentalphysik/Festkoerperphysik, Bochum (Germany)

    1996-11-01

    Neutron reflectivity measurements from extended surfaces, thin films and superlattices provide information on the chemical profile parallel to the film normal, including film thicknesses, average composition and interfacial roughness parameters. Reflectivity measurements with polarized neutrons are particularly powerful for analyzing the magnetic density profiles in thin films and superlattices in addition to chemical profiles. The basic theory of polarized neutron reflectivity is provided, followed by some examples and more recent applications concerning polarized neutron reflectivity studies from exchange coupled Fe/Cr superlattices. (author) 5 figs., 13 refs.

  13. Low energy x-ray spectrometer

    International Nuclear Information System (INIS)

    Woodruff, W.R.

    1981-01-01

    A subkilovolt spectrometer has been produced to permit high-energy-resolution, time-dependent x-ray intensity measurements. The diffracting element is a curved mica (d = 9.95A) crystal. To preclude higher order (n > 1) diffractions, a carbon x-ray mirror that reflects only photons with energies less than approx. 1.1 keV is utilized ahead of the diffracting element. The nominal energy range of interest is 800 to 900 eV. The diffracted photons are detected by a gold-surface photoelectric diode designed to have a very good frequency response, and whose current is recorded on an oscilloscope. A thin, aluminium light barrier is placed between the diffracting crystal and the photoelectric diode detector to keep any uv generated on or scattered by the crystal from illuminating the detector. High spectral energy resolution is provided by many photocathodes between 8- and 50-eV wide placed serially along the diffracted x-ray beam at the detector position. The spectrometer was calibrated for energy and energy dispersion using the Ni Lα 1 2 lines produced in the LLNL IONAC accelerator and in third order using a molybdenum target x-ray tube. For the latter calibration the carbon mirror was replaced by one surfaced with rhodium to raise the cut-off energy to about 3 keV. The carbon mirror reflection dependence on energy was measured using one of our Henke x-ray sources. The curved mica crystal diffraction efficiency was measured on our Low-Energy x-ray (LEX) machine. The spectrometer performs well although some changes in the way the x-ray mirror is held are desirable. 16 figures

  14. Imaging X-Ray Polarimetry Explorer (IXPE) Risk Management

    Science.gov (United States)

    Alexander, Cheryl; Deininger, William D.; Baggett, Randy; Primo, Attina; Bowen, Mike; Cowart, Chris; Del Monte, Ettore; Ingram, Lindsey; Kalinowski, William; Kelley, Anthony; hide

    2018-01-01

    The Imaging X-ray Polarimetry Explorer (IXPE) project is an international collaboration to build and fly a polarization sensitive X-ray observatory. The IXPE Observatory consists of the spacecraft and payload. The payload is composed of three X-ray telescopes, each consisting of a mirror module optical assembly and a polarization-sensitive X-ray detector assembly; a deployable boom maintains the focal length between the optical assemblies and the detectors. The goal of the IXPE Mission is to provide new information about the origins of cosmic X-rays and their interactions with matter and gravity as they travel through space. IXPE will do this by exploiting its unique capability to measure the polarization of X-rays emitted by cosmic sources. The collaboration for IXPE involves national and international partners during design, fabrication, assembly, integration, test, and operations. The full collaboration includes NASA Marshall Space Flight Center (MSFC), Ball Aerospace, the Italian Space Agency (ASI), the Italian Institute of Astrophysics and Space Planetology (IAPS)/Italian National Institute of Astrophysics (INAF), the Italian National Institute for Nuclear Physics (INFN), the University of Colorado (CU) Laboratory for Atmospheric and Space Physics (LASP), Stanford University, McGill University, and the Massachusetts Institute of Technology. The goal of this paper is to discuss risk management as it applies to the IXPE project. The full IXPE Team participates in risk management providing both unique challenges and advantages for project risk management. Risk management is being employed in all phases of the IXPE Project, but is particularly important during planning and initial execution-the current phase of the IXPE Project. The discussion will address IXPE risk strategies and responsibilities, along with the IXPE management process which includes risk identification, risk assessment, risk response, and risk monitoring, control, and reporting.

  15. Compton Reflection in AGN with Simbol-X

    Science.gov (United States)

    Beckmann, V.; Courvoisier, T. J.-L.; Gehrels, N.; Lubiński, P.; Malzac, J.; Petrucci, P. O.; Shrader, C. R.; Soldi, S.

    2009-05-01

    AGN exhibit complex hard X-ray spectra. Our current understanding is that the emission is dominated by inverse Compton processes which take place in the corona above the accretion disk, and that absorption and reflection in a distant absorber play a major role. These processes can be directly observed through the shape of the continuum, the Compton reflection hump around 30 keV, and the iron fluorescence line at 6.4 keV. We demonstrate the capabilities of Simbol-X to constrain complex models for cases like MCG-05-23-016, NGC 4151, NGC 2110, and NGC 4051 in short (10 ksec) observations. We compare the simulations with recent observations on these sources by INTEGRAL, Swift and Suzaku. Constraining reflection models for AGN with Simbol-X will help us to get a clear view of the processes and geometry near to the central engine in AGN, and will give insight to which sources are responsible for the Cosmic X-ray background at energies >20 keV.

  16. Resonant x-ray Raman scattering from atoms and molecules

    International Nuclear Information System (INIS)

    Cowan, P.L.

    1992-01-01

    Inelastic x-ray scattering and elastic x-ray scattering are fundamentally related processes. When the x-ray photon energy is near the ionization threshold for an inner shell, the inelastic channel is dominated by resonant x-ray Raman scattering. Studies of this emission not only illuminate the resonant scattering process in general, they also point to new opportunities for spectral studies of electronic structure using x-rays. Atoms in the form of a free gas provide an ideal target for testing the current theoretical understanding of resonant x-ray Raman scattering. In addition, x-ray scattering from molecular gases demonstrates the effect of bonding symmetry on the polarization and angular distribution of the scattered x-rays. Comparisons of experimental data with theory demonstrate both the successes and limitations of simple, single-electron interpretations of the scattering process

  17. Capabilities of using white x-rays for the reconstruction of surface morphology from coherent reflectivity

    Energy Technology Data Exchange (ETDEWEB)

    Sant, Tushar, E-mail: tushar@physik.uni-siegen.de [Solid State Physics Group, University of Siegen, 57068 Siegen (Germany); Panzner, Tobias [Paul Scherrer Institute (Switzerland); Pietsch, Ullrich [Solid State Physics Group, University of Siegen, 57068 Siegen (Germany)

    2010-10-15

    We present a new method to reconstruct the surface profile of a sample from coherent reflectivity data of a white x-ray beam experiment. As an example the surface profile of a laterally confined silicon wafer has been reconstructed quantitatively from static speckle measurements using white coherent x-rays from a bending magnet in the energy range between 5 < E < 20 keV. As a consequence of using white radiation, speckles appear in addition to the Airy pattern caused by scattering at the entrance pinhole. Nevertheless, the surface profile of a triangularly shaped specimen was reconstructed considering sufficient oversampling between the beam-footprint and the effective sample width. For the profile reconstruction the Error-Reduction phase retrieval algorithm was modified by including the spectral illumination function and a Fresnel propagator term. The simultaneous use of different x-ray energies having different penetration depth provides information on the evolution of the surface profile from the near-surface towards the bulk. The limitations of present experiment can be overcome using white or pink radiation from a source with higher photon flux.

  18. Multiple station beamline at an undulator x-ray source

    DEFF Research Database (Denmark)

    Als-Nielsen, J.; Freund, A.K.; Grübel, G.

    1994-01-01

    The undulator X-ray source is an ideal source for many applications: the beam is brilliant, highly collimated in all directions, quasi-monochromatic, pulsed and linearly polarized. Such a precious source can feed several independently operated instruments by utilizing a downstream series of X......-ray transparent monochromator crystals. Diamond in particular is an attractive monochromator as it is rather X-ray transparent and can be fabricated to a high degree of crystal perfection. Moreover, it has a very high heat conductivity and a rather small thermal expansion so the beam X-ray heat load problem...

  19. Hydrogen concentration and mass density of diamondlike carbon films obtained by x-ray and neutron reflectivity

    DEFF Research Database (Denmark)

    Findeisen, E.; Feidenhans'l, R.; Vigild, Martin Etchells

    1994-01-01

    Specular reflectivity of neutrons and x rays can be used to determine the scattering length density profile of a material perpendicular to its surface. We have applied these techniques to study amorphous, diamondlike, hydrocarbon films. By the combination of these two techniques we obtain not onl...

  20. NuSTAR SPECTROSCOPY OF MULTI-COMPONENT X-RAY REFLECTION FROM NGC 1068

    Energy Technology Data Exchange (ETDEWEB)

    Bauer, Franz E. [Pontificia Universidad Católica de Chile, Instituto de Astrofísica, Casilla 306, Santiago 22 (Chile); Arévalo, Patricia [EMBIGGEN Anillo, Concepción (Chile); Walton, Dominic J.; Baloković, Mislav; Brightman, Murray; Harrison, Fiona A. [Cahill Center for Astronomy and Astrophysics, California Institute of Technology, Pasadena, CA 91125 (United States); Koss, Michael J. [Institute for Astronomy, Department of Physics, ETH Zurich, Wolfgang-Pauli-Strasse 27, CH-8093 Zurich (Switzerland); Puccetti, Simonetta [ASDC-ASI, Via del Politecnico, I-00133 Roma (Italy); Gandhi, Poshak [School of Physics and Astronomy, University of Southampton, Highfield, Southampton SO17 1BJ (United Kingdom); Stern, Daniel [Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, CA 91109 (United States); Alexander, David M.; Moro, Agnese Del [Department of Physics, Durham University, South Road, Durham, DH1 3LE (United Kingdom); Boggs, Steve E.; Craig, William W. [Space Sciences Laboratory, University of California, Berkeley, CA 94720 (United States); Brandt, William N.; Luo, Bin [Department of Astronomy and Astrophysics, The Pennsylvania State University, 525 Davey Lab, University Park, PA 16802 (United States); Christensen, Finn E. [DTU Space, National Space Institute, Technical University of Denmark, Elektrovej 327, DK-2800 Lyngby (Denmark); Comastri, Andrea [INAF-Osservatorio Astronomico di Bologna, via Ranzani 1, I-40127 Bologna (Italy); Hailey, Charles J. [Columbia Astrophysics Laboratory, Columbia University, New York, NY 10027 (United States); Hickox, Ryan [Department of Physics and Astronomy, Dartmouth College, 6127 Wilder Laboratory, Hanover, NH 03755 (United States); and others

    2015-10-20

    We report on high-energy X-ray observations of the Compton-thick Seyfert 2 galaxy NGC 1068 with NuSTAR, which provide the best constraints to date on its >10 keV spectral shape. The NuSTAR data are consistent with those from past and current instruments to within cross-calibration uncertainties, and we find no strong continuum or line variability over the past two decades, which is in line with its X-ray classification as a reflection-dominated Compton-thick active galactic nucleus. The combined NuSTAR, Chandra, XMM-Newton, and Swift BAT spectral data set offers new insights into the complex secondary emission seen instead of the completely obscured transmitted nuclear continuum. The critical combination of the high signal-to-noise NuSTAR data and the decomposition of the nuclear and extranuclear emission with Chandra allow us to break several model degeneracies and greatly aid physical interpretation. When modeled as a monolithic (i.e., a single N{sub H}) reflector, none of the common Compton reflection models are able to match the neutral fluorescence lines and broad spectral shape of the Compton reflection hump without requiring unrealistic physical parameters (e.g., large Fe overabundances, inconsistent viewing angles, or poor fits to the spatially resolved spectra). A multi-component reflector with three distinct column densities (e.g., with best-fit values of N{sub H} of 1.4 × 10{sup 23}, 5.0 × 10{sup 24}, and 10{sup 25} cm{sup −2}) provides a more reasonable fit to the spectral lines and Compton hump, with near-solar Fe abundances. In this model, the higher N{sub H} component provides the bulk of the flux to the Compton hump, while the lower N{sub H} component produces much of the line emission, effectively decoupling two key features of Compton reflection. We find that ≈30% of the neutral Fe Kα line flux arises from >2″ (≈140 pc) and is clearly extended, implying that a significant fraction (and perhaps most) of the <10 keV reflected component

  1. SECCOX, a novel x-ray characterization bench for Bragg crystals and x-rays optics

    International Nuclear Information System (INIS)

    Caillaud, T.; Manson, M.; Desenne, D.; Goze, B.; Rivet, A.; Derouineau, Ph.

    2007-01-01

    Laser programs require the use of a large number of calibrated x-ray crystals implemented inside spectrometers and microscopes used in diagnostics. In this context, a new apparatus was designed in collaboration with CELIA laboratory, Saint-Gobain Crystals and Detectors and CEA to characterize x-ray Bragg crystals. Station d'Etude et de Caracterisation des Cristaux pour les Optiques X (SECCOX) is based on a micrometric x-ray source and an automated spectrometer equipped with a CCD camera. Properties such as homogeneity, resolution, radius of curvature and reflectivity are measured to guarantee diagnostic performance in laser-plasma physics experiments. We will present the experimental device, techniques and results of the calibration obtained. (authors)

  2. PAL-XFEL soft X-ray scientific instruments and X-ray optics: First commissioning results

    Science.gov (United States)

    Park, Sang Han; Kim, Minseok; Min, Changi-Ki; Eom, Intae; Nam, Inhyuk; Lee, Heung-Soo; Kang, Heung-Sik; Kim, Hyeong-Do; Jang, Ho Young; Kim, Seonghan; Hwang, Sun-min; Park, Gi-Soo; Park, Jaehun; Koo, Tae-Yeong; Kwon, Soonnam

    2018-05-01

    We report an overview of soft X-ray scientific instruments and X-ray optics at the free electron laser (FEL) of the Pohang Accelerator Laboratory, with selected first-commissioning results. The FEL exhibited a pulse energy of 200 μJ/pulse, a pulse width of power of 10 500 was achieved. The estimated total time resolution between optical laser and X-ray pulses was <270 fs. A resonant inelastic X-ray scattering spectrometer was set up; its commissioning results are also reported.

  3. Air ionizatio at X-ray departments

    International Nuclear Information System (INIS)

    Vesela, O.; Mosatova, A.; Kubova, Z.

    1987-01-01

    Changes in electroionic microclimate are dealt with at X-ray workplaces and their dynamics in the course of the day during normal operation. Following exposure to X-ray radiation the specific concentration of light air ions of both polarities increases due to increased input of ionization energy. Within the first minutes following the termination of exposure a sharp decline takes place in the specific concentration of light air ions with subsequent well of positive ions in the air. (author). 1 tab., 19 refs

  4. Ocean color remote sensing using polarization properties of reflected sunlight

    Science.gov (United States)

    Frouin, R.; Pouliquen, E.; Breon, F.-M.

    1994-01-01

    The effects of the atmosphere and surface on sunlight backscattered to space by the ocean may be substantially reduced by using the unpolarized component of reflectance instead of total reflectance. At 450 nm, a wavelength of interest in ocean color remote sensing, and for typical conditions, 45% of the unpolarized reflectance may originate from the water body instead of 20% of the total reflectance, which represents a gain of a factor 2.2 in useful signal for water composition retrieval. The best viewing geometries are adjacent to the glitter region; they correspond to scattering angles around 100 deg, but they may change slightly depending on the polarization characteristics of the aerosols. As aerosol optical thickness increases, the atmosphere becomes less efficient at polarizing sunlight, and the enhancement of the water body contribution to unpolarized reflectance is reduced. Since the perturbing effects are smaller on unpolarized reflectance, at least for some viewing geometries, they may be more easily corrected, leading to a more accurate water-leaving signal and, therefore, more accurate estimates of phytoplankton pigment concentration.

  5. On the viability of exploiting L