Development of micro-beam NRA for 3D-mapping of hydrogen distribution in solids: Application of tapered glass capillary to 6 MeV 15N ion

International Nuclear Information System (INIS)

Sekiba, D.; Yonemura, H.; Nebiki, T.; Wilde, M.; Ogura, S.; Yamashita, H.; Matsumoto, M.; Kasagi, J.; Iwamura, Y.; Itoh, T.; Matsuzaki, H.; Narusawa, T.; Fukutani, K.

2008-01-01

A micro-beam NRA system, by means of a resonant nuclear reaction 1 H( 15 N, αγ) 12 C, has been developed for the purpose of the 3D mapping of the hydrogen distribution in solids. To obtain the tens μm size of the beam spot, the combination of the newly proposed tapered glass capillary and a conventional quadrupole magnetic lens is employed. An Y patterned film on a substrate is prepared as an application of the developed system. The 6 MeV 15 N beam focused by glass capillaries down to 50 μm successfully shows the hydrogen distribution. The in-plane NRA profile implies that the beam emitted from the glass capillary outlet is parallel, although the original beam has a considerable divergence. The NRA measurements in the 10 3 Pa N 2 atmosphere due to the low gas conductance of the glass capillary is also demonstrated

High-resolution hydrogen profiling in AlGaN/GaN heterostructures grown by different epitaxial methods

Energy Technology Data Exchange (ETDEWEB)

Gonzalez-Posada Flores, F; Redondo-Cubero, A; Bengoechea, A; Brana, A F; Munoz, E [Instituto de Sistemas Optoelectronicos y Microtecnologia (ISOM) and Dpto. IngenierIa Electronica (DIE), ETSI de Telecomunicacion, Universidad Politecnica de Madrid, E-28040 Madrid (Spain); Gago, R [Centro de Micro-Analisis de Materiales, Universidad Autonoma de Madrid, E-28049 Madrid (Spain); Jimenez, A [Dpto. Electronica, Escuela Politecnica Superior, Universidad de Alcala, E-28805 Alcala de Henares, Madrid (Spain); Grambole, D, E-mail: fposada@die.upm.e [Institute of Ion Beam Physics and Materials Research, Forschungszentrum Dresden-Rossendorf, PF 51019, D-01314 Dresden (Germany)

2009-03-07

Hydrogen (H) incorporation into AlGaN/GaN heterostructures used in high electron mobility transistors, grown by different methods, is studied by high-resolution depth profiling. Samples grown on sapphire and Si(1 1 1) substrates by molecular-beam epitaxy and metal-organic vapour phase epitaxy; involving H-free and H-containing precursors, were analysed to evaluate the eventual incorporation of H into the wafer. The amount of H was measured by means of nuclear reaction analysis (NRA) using the {sup 1}H({sup 15}N,{alpha}{gamma}){sup 12}C reaction up to a depth of {approx}110 nm into the heterostructures. Interestingly, the H profiles are similar in all the samples analysed, with an increasing H content towards the surface and a negligible H incorporation into the GaN layer (0.24 {+-} 0.08 at%) or at the AlGaN/GaN interface. Therefore, NRA shows that H uptake is not related to the growth process or technique employed and that H contamination may be due to external sources after growth. The eventual correlation between topographical defects on the AlGaN surface and the H concentration are also discussed.

The Streptococcus pyogenes serotype M49 Nra-Ralp3 transcriptional regulatory network and its control of virulence factor expression from the novel eno ralp3 epf sagA pathogenicity region.

Science.gov (United States)

Kreikemeyer, Bernd; Nakata, Masanobu; Köller, Thomas; Hildisch, Hendrikje; Kourakos, Vassilios; Standar, Kerstin; Kawabata, Shigetada; Glocker, Michael O; Podbielski, Andreas

2007-12-01

Many Streptococcus pyogenes (group A streptococcus [GAS]) virulence factor- and transcriptional regulator-encoding genes cluster together in discrete genomic regions. Nra is a central regulator of the FCT region. Previous studies exclusively described Nra as a transcriptional repressor of adhesin and toxin genes. Here transcriptome and proteome analysis of a serotype M49 GAS strain and an isogenic Nra mutant of this strain revealed the complete Nra regulon profile. Nra is active in all growth phases tested, with the largest regulon in the transition phase. Almost exclusively, virulence factor-encoding genes are repressed by Nra; these genes include the GAS pilus operon, the capsule synthesis operon, the cytolysin-mediated translocation system genes, all Mga region core virulence genes, and genes encoding other regulators, like the Ihk/Irr system, Rgg, and two additional RofA-like protein family regulators. Surprisingly, our experiments revealed that Nra additionally acts as a positive regulator, mostly for genes encoding proteins and enzymes with metabolic functions. Epidemiological investigations revealed strong genetic linkage of one particular Nra-repressed regulator, Ralp3 (SPy0735), with a gene encoding Epf (extracellular protein factor from Streptococcus suis). In a serotype-specific fashion, this ralp3 epf gene block is integrated, most likely via transposition, into the eno sagA virulence gene block, which is present in all GAS serotypes. In GAS serotypes M1, M4, M12, M28, and M49 this novel discrete genetic region is therefore designated the eno ralp3 epf sagA (ERES) pathogenicity region. Functional experiments showed that Epf is a novel GAS plasminogen-binding protein and revealed that Ralp3 activity counteracts Nra and MsmR regulatory activity. In addition to the Mga and FCT regions, the ERES region is the third discrete chromosomal pathogenicity region. All of these regions are transcriptionally linked, adding another level of complexity to the known

The Streptococcus pyogenes Serotype M49 Nra-Ralp3 Transcriptional Regulatory Network and Its Control of Virulence Factor Expression from the Novel eno ralp3 epf sagA Pathogenicity Region▿ †

Science.gov (United States)

Kreikemeyer, Bernd; Nakata, Masanobu; Köller, Thomas; Hildisch, Hendrikje; Kourakos, Vassilios; Standar, Kerstin; Kawabata, Shigetada; Glocker, Michael O.; Podbielski, Andreas

2007-01-01

Many Streptococcus pyogenes (group A streptococcus [GAS]) virulence factor- and transcriptional regulator-encoding genes cluster together in discrete genomic regions. Nra is a central regulator of the FCT region. Previous studies exclusively described Nra as a transcriptional repressor of adhesin and toxin genes. Here transcriptome and proteome analysis of a serotype M49 GAS strain and an isogenic Nra mutant of this strain revealed the complete Nra regulon profile. Nra is active in all growth phases tested, with the largest regulon in the transition phase. Almost exclusively, virulence factor-encoding genes are repressed by Nra; these genes include the GAS pilus operon, the capsule synthesis operon, the cytolysin-mediated translocation system genes, all Mga region core virulence genes, and genes encoding other regulators, like the Ihk/Irr system, Rgg, and two additional RofA-like protein family regulators. Surprisingly, our experiments revealed that Nra additionally acts as a positive regulator, mostly for genes encoding proteins and enzymes with metabolic functions. Epidemiological investigations revealed strong genetic linkage of one particular Nra-repressed regulator, Ralp3 (SPy0735), with a gene encoding Epf (extracellular protein factor from Streptococcus suis). In a serotype-specific fashion, this ralp3 epf gene block is integrated, most likely via transposition, into the eno sagA virulence gene block, which is present in all GAS serotypes. In GAS serotypes M1, M4, M12, M28, and M49 this novel discrete genetic region is therefore designated the eno ralp3 epf sagA (ERES) pathogenicity region. Functional experiments showed that Epf is a novel GAS plasminogen-binding protein and revealed that Ralp3 activity counteracts Nra and MsmR regulatory activity. In addition to the Mga and FCT regions, the ERES region is the third discrete chromosomal pathogenicity region. All of these regions are transcriptionally linked, adding another level of complexity to the known

Development of Cold Neutron Depth Profiling System at HANARO

International Nuclear Information System (INIS)

Park, B. G.; Choi, H. D.; Sun, G. M.

2012-01-01

The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. A number of analytical techniques for depth profiling have been developed. Neutron Depth Profiling (NDP) system which was developed by Ziegler et al. is one of the leading analytical techniques. In NDP, a thermal or cold neutron beam passes through a material and interacts with certain isotopes that are known to emit monoenergetic-charged particle remaining a recoil nucleus after neutron absorption. The depth is obtained from the energy loss of those charged particles escaping surface of substrate material. For various applications of NDP technique, the Cold Neutron Depth Profiling System (CN-NDP) was developed at a neutron guide CG1 installed at the HANARO cold neutron source. In this study the design features of the cold neutron beam and target chamber for the CN-NDP system are given. Also, some experiments for the performance tests of the CN-NDP system are described

Depth profile measurement with lenslet images of the plenoptic camera

Science.gov (United States)

Yang, Peng; Wang, Zhaomin; Zhang, Wei; Zhao, Hongying; Qu, Weijuan; Zhao, Haimeng; Asundi, Anand; Yan, Lei

2018-03-01

An approach for carrying out depth profile measurement of an object with the plenoptic camera is proposed. A single plenoptic image consists of multiple lenslet images. To begin with, these images are processed directly with a refocusing technique to obtain the depth map, which does not need to align and decode the plenoptic image. Then, a linear depth calibration is applied based on the optical structure of the plenoptic camera for depth profile reconstruction. One significant improvement of the proposed method concerns the resolution of the depth map. Unlike the traditional method, our resolution is not limited by the number of microlenses inside the camera, and the depth map can be globally optimized. We validated the method with experiments on depth map reconstruction, depth calibration, and depth profile measurement, with the results indicating that the proposed approach is both efficient and accurate.

Shallow surface depth profiling with atomic resolution

International Nuclear Information System (INIS)

Xi, J.; Dastoor, P.C.; King, B.V.; O'Connor, D.J.

1999-01-01

It is possible to derive atomic layer-by-layer composition depth profiles from popular electron spectroscopic techniques, such as X-ray photoelectron spectroscopy (XPS) or Auger electron spectroscopy (AES). When ion sputtering assisted AES or XPS is used, the changes that occur during the establishment of the steady state in the sputtering process make these techniques increasingly inaccurate for depths less than 3nm. Therefore non-destructive techniques of angle-resolved XPS (ARXPS) or AES (ARAES) have to be used in this case. In this paper several data processing algorithms have been used to extract the atomic resolved depth profiles of a shallow surface (down to 1nm) from ARXPS and ARAES data

Using elastic peak electron spectroscopy for enhanced depth resolution in sputter profiling

International Nuclear Information System (INIS)

Hofmann, S.; Kesler, V.

2002-01-01

Elastic peak electron spectroscopy (EPES) is an alternative to AES in sputter depth profiling of thin film structures. In contrast to AES, EPES depth profiling is not influenced by chemical effects. The high count rate ensures a good signal to noise ratio, that is lower measurement times and/or higher precision. In addition, because of the elastically scattered electrons travel twice through the sample, the effective escape depth is reduced, an important factor for the depth resolution function. Thus, the depth resolution is increased. EPES depth profiling was successfully applied to a Ge/Si multilayer structure. For an elastic peak energy of 1.0 keV the information depth is considerably lower (0.8 nm) as compared to the Ge (LMM, 1147 eV) peak (1.6 nm) used in AES depth profiling, resulting in a respectively improved depth resolution for EPES profiling under otherwise similar profiling conditions. EPES depth profiling is successfully applied to measure small diffusion lengths at Ge/Si interfaces of the order of 1 nm. (Authors)

A new method for depth profiling

International Nuclear Information System (INIS)

Chittleborough, C.W.; Chaudhri, M.A.; Rouse, J.L.

1978-01-01

A simple method for obtaining depth profiles of concentrations has been developed for charged particle induced nuclear reactions which produce γ-rays or neutrons. This method is particularly suitable for non-resonant reactions but is also applicable to resonant reactions and can examine the concentration of the sought nuclide throughout the entire activation depth of the incoming particles in the matrix

Depth-profiling using X-ray photoelectron spectroscopy

International Nuclear Information System (INIS)

Pijolat, M.; Hollinger, G.

1980-12-01

The possibilities of X-ray photoelectron spectroscopy (or ESCA) for depth-profiling into shallow depths (approximately 10-100 A) have been studied. The method of ion-sputtering removal has first been investigated in order to improve its depth-resolution (approximately 50-150 A). A procedure which eliminates the effects due to the resolution function of the instrumental probe (analysed depth approximately 50 A) has been settled; but it is not yet sufficient, and the sputter - broadening due to the ion-induced damages must be taken into account (broadening function approximately 50 A for approximately 150 A removal). Because of serious difficulties in estimating the broadening function an alternative is to develop non destructive methods, so a new method based on the dependence of the analysed depth with the electron emission angle is presented. The extraction of the concentration profile from angular distribution experiments is achieved, in the framework of a flat-layer model, by minimizing the difference between theoretical and experimental relative intensities. The applicability and limitations of the method are discussed on the basis of computer simulation results. The depth probed is of the order of 3 lambda (lambda being the value of the inelastic mean free path, typically 10-20 A) and the depth-resolution is of the order of lambda/3 [fr

Hydrogen depth resolution in multilayer metal structures, comparison of elastic recoil detection and resonant nuclear reaction method

Energy Technology Data Exchange (ETDEWEB)

Wielunski, L.S. E-mail: leszekw@optushome.com.au; Grambole, D.; Kreissig, U.; Groetzschel, R.; Harding, G.; Szilagyi, E

2002-05-01

Four different metals: Al, Cu, Ag and Au have been used to produce four special multilayer samples to study the depth resolution of hydrogen. The layer structure of each sample was analysed using 2 MeV He Rutherford backscattering spectrometry, 4.5 MeV He elastic recoil detection (ERD) and 30 MeV F{sup 6+} HIERD. Moreover the hydrogen distribution was analysed in all samples using H({sup 15}N, {alpha}{gamma}){sup 12}C nuclear reaction analysis (NRA) with resonance at 6.385 MeV. The results show that the best depth resolution and sensitivity for hydrogen detection are offered by resonance NRA. The He ERD shows good depth resolution only for the near surface hydrogen. In this technique the depth resolution is rapidly reduced with depth due to multiple scattering effects. The 30 MeV F{sup 6+} HIERD demonstrated similar hydrogen depth resolution to He ERD for low mass metals and HIERD resolution is substantially better for heavy metals and deep layers.

Wind profiler mixing depth and entrainment measurements with chemical applications

Energy Technology Data Exchange (ETDEWEB)

Angevine, W.M.; Trainer, M.; Parrish, D.D.; Buhr, M.P.; Fehsenfeld, F.C. [NOAA Aeronomy Lab., Boulder, CO (United States); Kok, G.L. [NCAR Research Aviation Facility, Boulder, CO (United States)

1994-12-31

Wind profiling radars operating at 915 MHz have been present at a number of regional air quality studies. The profilers can provide a continuous, accurate record of the depth of the convective mixed layer with good time resolution. Profilers also provide information about entrainment at the boundary layer top. Mixing depth data from several days of the Rural Oxidants in the Southern Environment II (ROSE II) study in Alabama in June, 1992 are presented. For several cases, chemical measurements from aircraft and ground-based instruments are shown to correspond to mixing depth and entrainment zone behavior observed by the profiler.

Photodegradation of wood and depth profile analysis

International Nuclear Information System (INIS)

Kataoka, Y.

2008-01-01

Photochemical degradation is a key process of the weathering that occurs when wood is exposed outdoors. It is also a major cause of the discoloration of wood in indoor applications. The effects of sunlight on the chemical composition of wood are superficial in nature, but estimates of the depth at which photodegradation occurs in wood vary greatly from 80 microm to as much as 2540 mic rom. Better understanding of the photodegradation of wood through depth profile analysis is desirable because it would allow the development of more effective photo-protective treatments that target the surface layers of wood most susceptible to photodegradation. This paper briefly describes fundamental aspects of photodegradation of wood and reviews progress made in the field of depth profile study on the photodegradation of wood. (author)

Molecular depth profiling of organic and biological materials

Energy Technology Data Exchange (ETDEWEB)

Fletcher, John S. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom)]. E-mail: John.Fletcher@manchester.ac.uk; Conlan, Xavier A. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom); Lockyer, Nicholas P. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom); Vickerman, John C. [Surface Analysis Research Centre, School of Chemical Engineering and Analytical Science, University of Manchester, Manchester M60 1QD (United Kingdom)

2006-07-30

Atomic depth profiling using secondary ion mass spectrometry, SIMS, is common in the field micro-electronics; however, the generation of molecular information as a function of sample depth is difficult due to the accumulation of damage both on and beneath the sample surface. The introduction of polyatomic ion beams such as SF{sub 5} and C{sub 60} have raised the possibility of overcoming this problem as they deposit the majority of their energy in the upper surface of the sample resulting in increased sputter yields but with a complimentary reduction in sub-surface damage accumulation. In this paper we report the depth profile analysis of the bio-polymer polycaprolactone, PCL, using the polyatomic ions Au{sub 3}{sup +} and C{sub 60}{sup +} and the monoatomic Au{sup +}. Results are compared to recent analysis of a similar sample using SF{sub 5}{sup +}. C{sub 60}{sup +} depth profiling of cellulose is also demonstrated, an experiment that has been reported as unsuccessful when attempted with SF{sub 5}{sup +} implications for biological analysis are discussed.

Depth profiling of extended defects in silicon by Rutherford backscattering measurements

International Nuclear Information System (INIS)

Gruska, B.; Goetz, G.

1981-01-01

Depth profiling of dislocations and stacking faults is carried out by analyzing axial and planar channeling data from As + -and P + -implanted silicon samples annealed at high temperatures. The analyzing procedure is based on the simple two-beam model. The results show that depth profiling of dislocations using planar channeling data is connected with a broadening of the real distributions. A degradation of the defect concentration and a deformation of the profile result for very high defect concentrations (> 5 x 10 5 cm/cm 2 ). All these effects can be neglected by analyzing axial channeling data. Depth profiling of stacking faults is restricted to the determination of the depth distribution of displaced atomic rows or planes. For both the procedures, axial as well as planar channeling measurements, the same depth profiles of displaced atomic rows are obtained. (author)

Nitrate reductase activity (NRA in the invasive alien Fallopia japonica: seasonal variation, differences among habitats types, and comparison with native species

Directory of Open Access Journals (Sweden)

Damian Chmura

2016-09-01

Full Text Available Nitrate reductase activity (NRA was studied in the invasive alien plant F. japonica (Japanese knotweed during the vegetation season and among natural, semi-natural, and human-made habitats and compared with NRA in selected native species. NRA was measured directly in the field from the beginning of May until the beginning of October. NRA was much higher than in the plant’s native range, i.e., East Asia, and showed a high degree of variation over time with the highest values being reached at the stage of fast vegetative growth and at the beginning of fruiting. NRA was highest on dumping sites probably due to the high nitrogen input into soils and near traffic and the emission of NOx by vehicles. A comparison of the enzyme activity in four selected native plant species indicated that NRA in F. japonica was the highest with the exception of Urtica dioica, which exhibited a similar activity of the enzyme. A detailed comparison with this species showed that differences between these species on particular dates were influenced by differences in the phenology of both plants. The initial results that were obtained suggest that nitrogen pollution in an environment can contribute to habitat invasibility and a high level of NRA, which in addition to the many plant traits that are commonly accepted as characteristic of invasiveness features, may be an important factor that enhances invasion success.

Development and Applications of Time of Flight Neutron Depth Profiling

International Nuclear Information System (INIS)

Cady, Bingham; Unlu, Kenan

2005-01-01

The depth profiles of intentional or intrinsic constituents of a sample provide valuable information for the characterization of materials. For example, the subtle differences in spatial distribution and composition of many chemical species in the near surface region and across interfacial boundaries can significantly alter the electronic and optical properties of materials. A number of analytical techniques for depth profiling have been developed during the last two decades. neutron Depth Profiling (NDP) is one of the leading analytical techniques. The NDP is a nondestructive near surface technique that utilizes thermal/cold neutron beam to measure the concentration of specific light elements versus their depth in materials. The depth is obtained from the energy loss of protons, alphas or recoil atoms in substrate materials. Since the charged particle energy determination using surface barrier detector is used for NDP, the depth resolution is highly dependent on the detectors an d detection instruments. The depth resolutions of a few tens of nm are achieved with available NDP facilities in the world. However, the performance of NDP needs to be improved in order to obtain a few A depth resolutions

The role of micro-NRA and micro-PIXE in carbon mapping of organic tissues

International Nuclear Information System (INIS)

Niekraszewicz, L.A.B.; Souza, C.T. de; Stori, E.M.; Jobim, P.F.C.; Amaral, L.; Dias, J.F.

2015-01-01

This study reports the work developed in the Ion Implantation Laboratory (Porto Alegre, RS, Brazil) in order to implement the micro-NRA technique for the study of light elements in organic tissues. In particular, the work was focused on nuclear reactions employing protons and alphas with carbon. The (p,p) resonances at 0.475 and 1.734 were investigated. The (α,α) resonance at 4.265 MeV was studied as well. The results indicate that the yields for the 0.475 and 1.734 MeV resonances are similar. Elemental maps of different structures obtained with the micro-NRA technique using the 1.734 MeV resonance were compared with those obtained with micro-PIXE employing a SDD detector equipped with an ultra-thin window. The results show that the use of micro-NRA for carbon at 1.734 MeV resonance provides good results in some cases at the expense of longer beam times. On the other hand, micro-PIXE provides enhanced yields but is limited to surface analysis since soft X-rays are greatly attenuated by matter

An optical fiber expendable seawater temperature/depth profile sensor

Science.gov (United States)

Zhao, Qiang; Chen, Shizhe; Zhang, Keke; Yan, Xingkui; Yang, Xianglong; Bai, Xuejiao; Liu, Shixuan

2017-10-01

Marine expendable temperature/depth profiler (XBT) is a disposable measuring instrument which can obtain temperature/depth profile data quickly in large area waters and mainly used for marine surveys, scientific research, military application. The temperature measuring device is a thermistor in the conventional XBT probe (CXBT)and the depth data is only a calculated value by speed and time depth calculation formula which is not an accurate measurement result. Firstly, an optical fiber expendable temperature/depth sensor based on the FBG-LPG cascaded structure is proposed to solve the problems of the CXBT, namely the use of LPG and FBG were used to detect the water temperature and depth, respectively. Secondly, the fiber end reflective mirror is used to simplify optical cascade structure and optimize the system performance. Finally, the optical path is designed and optimized using the reflective optical fiber end mirror. The experimental results show that the sensitivity of temperature and depth sensing based on FBG-LPG cascade structure is about 0.0030C and 0.1%F.S. respectively, which can meet the requirements of the sea water temperature/depth observation. The reflectivity of reflection mirror is in the range from 48.8% to 72.5%, the resonant peak of FBG and LPG are reasonable and the whole spectrum are suitable for demodulation. Through research on the optical fiber XBT (FXBT), the direct measurement of deep-sea temperature/depth profile data can be obtained simultaneously, quickly and accurately. The FXBT is a new all-optical seawater temperature/depth sensor, which has important academic value and broad application prospect and is expected to replace the CXBT in the future.

PIXE depth profiling using variation of detection angle

International Nuclear Information System (INIS)

Miranda, J.; Rickards, J.; Trejo-Luna, R.

2006-01-01

A method to apply particle induced X-ray emission (PIXE) for depth profiling, based on the variation of the X-ray detection angle, is proposed. The procedure uses X-ray yields normalized to those emitted at a particular reference angle. Application of the method to implanted samples and thin metallic films gave excellent results regarding the range of implanted ions and film thickness, respectively. However, there is no complete information about the width of the distribution of the implanted ions, emphasizing the need to develop a full mathematical algorithm to obtain the general depth profile

Optimizing Nuclear Reaction Analysis (NRA) using Bayesian Experimental Design

International Nuclear Information System (INIS)

Toussaint, Udo von; Schwarz-Selinger, Thomas; Gori, Silvio

2008-01-01

Nuclear Reaction Analysis with 3 He holds the promise to measure Deuterium depth profiles up to large depths. However, the extraction of the depth profile from the measured data is an ill-posed inversion problem. Here we demonstrate how Bayesian Experimental Design can be used to optimize the number of measurements as well as the measurement energies to maximize the information gain. Comparison of the inversion properties of the optimized design with standard settings reveals huge possible gains. Application of the posterior sampling method allows to optimize the experimental settings interactively during the measurement process.

Applications of positron depth profiling

Energy Technology Data Exchange (ETDEWEB)

Hakvoort, R A

1993-12-23

In this thesis some contributions of the positron-depth profiling technique to materials science have been described. Following studies are carried out: Positron-annihilation measurements on neon-implanted steel; Void creation in silicon by helium implantation; Density of vacancy-type defects present in amorphous silicon prepared by ion implantation; Measurements of other types of amorphous silicon; Epitaxial cobalt disilicide prepared by cobalt outdiffusion. Positron-annihilation experiments on low-pressure CVD silicon-nitride films. (orig./MM).

Applications of positron depth profiling

International Nuclear Information System (INIS)

Hakvoort, R.A.

1993-01-01

In this thesis some contributions of the positron-depth profiling technique to materials science have been described. Following studies are carried out: Positron-annihilation measurements on neon-implanted steel; Void creation in silicon by helium implantation; Density of vacancy-type defects present in amorphous silicon prepared by ion implantation; Measurements of other types of amorphous silicon; Epitaxial cobalt disilicide prepared by cobalt outdiffusion. Positron-annihilation experiments on low-pressure CVD silicon-nitride films. (orig./MM)

Depth profiling of tritium by neutron time-of-flight

International Nuclear Information System (INIS)

Davis, J.C.; Anderson, J.D.; Lefevre, H.W.

1976-01-01

A method to measure the depth profile of tritium implanted or absorbed in materials was developed. The sample to be analyzed is bombarded with a pulsed proton beam and the energy of neutrons produced by the T(p,n) reaction is measured by the time-of-flight technique. From the neutron energy the depth in the target of the T atoms may be inferred. A sensitivity of 0.1 at. percent T or greater is possible. The technique is non-destructive and may be used with thick or radioactive host materials. Samples up to 20 μm in thickness may be profiled with resolution limited by straggling of the proton beam for depths greater than 1 μm. Deuterium depth profiling has been demonstrated using the D(d,n) reaction. The technique has been used to observe the behavior of an implantation spike of T produced by a 400 keV T + beam stopping at a depth of 3 μm in 11 μm thick layers of Ti and TiH. The presence of H in the Ti lattice is observed to inhibit the diffusion of T through the lattice. Effects of the total hydrogen concentration (H + T) being forced above stochiometry at the implantation site are suggested by the shapes of the implantation spikes

Depth profile analysis of polymerized fluorine compound on photo-resist film with angle-resolved XPS

International Nuclear Information System (INIS)

Iijima, Yoshitoki; Kubota, Toshio; Oinaka, Syuhei

2013-01-01

Angle-resolved XPS (ARXPS) is an observation technique which is very effective in chemical depth analysis method less than photoelectron detected depth. For the analysis of depth profile, several analysis methods have been proposed to calculate the depth profile using the ARXPS method. The present report is the measurements of depth profile of the fluorine in a fluorine-containing photo-resist film using the ARXPS method and the depth profile of concentration have been successfully determined using the ARCtick 1.0 software. It has been observed that thickness of the fluorocarbon enriched surface layer of the photo-resist was 2.7 nm, and so that the convert of the ARXPS data from the angle profile to the depth profile was proved to be useful analysis method for the ultrathin layer depth. (author)

Hydrogen depth profiling using elastic recoil detection

International Nuclear Information System (INIS)

Doyle, B.L.; Peercy, P.S.

1979-01-01

The elastic recoil detection (ERD) analysis technique for H profiling in the near surface regions of solids is described. ERD is shown to have the capability of detecting H and its isotopes down to concentrations of approx. 0.01 at. % with a depth resolution of a few hundred angstroms. Is is demonstrated that 2.4-MeV He ions can be used successfully to profile 1 H and 2 D using this technique. 12 figures

Genetic Algorithm for Opto-thermal Skin Hydration Depth Profiling Measurements

Science.gov (United States)

Cui, Y.; Xiao, Perry; Imhof, R. E.

2013-09-01

Stratum corneum is the outermost skin layer, and the water content in stratum corneum plays a key role in skin cosmetic properties as well as skin barrier functions. However, to measure the water content, especially the water concentration depth profile, within stratum corneum is very difficult. Opto-thermal emission radiometry, or OTTER, is a promising technique that can be used for such measurements. In this paper, a study on stratum corneum hydration depth profiling by using a genetic algorithm (GA) is presented. The pros and cons of a GA compared against other inverse algorithms such as neural networks, maximum entropy, conjugate gradient, and singular value decomposition will be discussed first. Then, it will be shown how to use existing knowledge to optimize a GA for analyzing the opto-thermal signals. Finally, these latest GA results on hydration depth profiling of stratum corneum under different conditions, as well as on the penetration profiles of externally applied solvents, will be shown.

Hardness depth profiling of case hardened steels using a three-dimensional photothermal technique

International Nuclear Information System (INIS)

Qu Hong; Wang Chinhua; Guo Xinxin; Mandelis, Andreas

2010-01-01

A method of retrieving thermophysical depth profiles of continuously inhomogeneous materials is presented both theoretically and experimentally using the three-dimensional (3-D) photothermal radiometry. A 3-D theoretical model suitable for characterizing solids with arbitrary continuously varying thermophysical property depth profiles and finite (collimated or focused) laser beam spotsize is developed. A numerical fitting algorithm to retrieve the thermophysical profile was demonstrated with three case hardened steel samples. The reconstructed thermal conductivity depth profiles were found to be well anti-correlated with microhardness profiles obtained with the conventional indenter method.

Hydrogen diffusion between plasma-deposited silicon nitride-polyimide polymer interfaces

International Nuclear Information System (INIS)

Nguyen, S.V.; Kerbaugh, M.

1988-01-01

This paper reports a nuclear reaction analysis (NRA) for hydrogen technique used to analyze the hydrogen concentration near plasma enhanced chemical vapor deposition (PECVD) silicon nitride-polyimide interfaces at various nitride-deposition and polyimide-polymer-curing temperatures. The CF 4 + O 2 (8% O 2 ) plasma-etch-rate variation of PECVD silicon nitride films deposited on polyimide appeared to correlate well with the variation of hydrogen-depth profiles in the nitride films. The NRA data indicate that hydrogen-depth-profile fluctuation in the nitride films is due to hydrogen diffusion between the nitride-polyimide interfaces during deposition. Annealing treatment of polyimide films in a hydrogen atmosphere prior to the nitride film deposition tends to enhance the hydrogen-depth-profile uniformity in the nitride films, and thus substantially reduces or eliminates variation in the nitride plasma-etch rate

Depth profiling of helium in Ni and Nb; comparison of different methods

International Nuclear Information System (INIS)

Scherzer, B.M.U.; Bay, H.L.; Behrisch, R.; Boergesen, P.; Roth, J.

1978-01-01

Depth profiles of 30 keV 3 He + and 4 He + implanted in polycrystalline nickel and single crystal niobium have been measured using the nuclear reactions He(p,p)He and 3 He(d,α) 1 H. The formalism for obtaining depth profiles from Rutherford backscattering spectra has been generalized for the application to nuclear reaction spectra. The profiles obtained by the two different methods agree within the errors introduced by the uncertainties of the reaction cross-section and electronic stopping power data. The 3 He(d,α) 1 H method is a factor of 10-100 more sensitive and has about a factor of 5 better depth resolution than the He(p,p)He method. However, the latter method allows to probe much larger depths and is simultaneously applicable to 4 He as well as to 3 He. Within the experimental uncertainties the depth profiles for 3 He and 4 He are identical. (Auth.)

The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profiles

International Nuclear Information System (INIS)

Carter, G.; Katardjiev, I.V.; Nobes, M.J.

1989-01-01

The quasi-linear partial differential continuity equations that describe the evolution of the depth profiles and surface concentrations of marker atoms in kinematically equivalent systems undergoing sputtering, ion collection and atomic mixing are solved using the method of characteristics. It is shown how atomic mixing probabilities can be deduced from measurements of ion collection depth profiles with increasing ion fluence, and how this information can be used to predict surface concentration evolution. Even with this information, however, it is shown that it is not possible to deconvolute directly the surface concentration measurements to provide initial depth profiles, except when only ion collection and sputtering from the surface layer alone occur. It is demonstrated further that optimal recovery of initial concentration depth profiles could be ensured if the concentration-measuring analytical probe preferentially sampled depths near and at the maximum depth of bombardment-induced perturbations. (author)

Tritium depth profiling in carbon by accelerator mass spectrometry

International Nuclear Information System (INIS)

Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.; Bekris, N.; Penzhorn, R.-D.

2000-01-01

Tritium depth profiling measurements by accelerator mass spectrometry have been performed at the facility installed at the Rossendorf 3 MV Tandetron. In order to achieve a uniform erosion at the target surface inside a commercial Cs ion sputtering source and to avoid edge effects, the samples were mechanically scanned and the signals were recorded only during sputtering at the centre of the sputtered area. The sputtered negative ions were mass analysed by the injection magnet of the Tandetron. Hydrogen and deuterium profiles were measured with the Faraday cup between the injection magnet and the accelerator, while the tritium was counted after the accelerator with semiconductor detectors. Depth profiles have been measured for carbon samples which had been exposed to the plasma at the first wall of the Garching fusion experiment ASDEX-Upgrade and from the European fusion experiment JET, Culham, UK

Determination and theoretical analysis of the differential cross sections of the 2H(d,p) reaction at energies and detection angles suitable for NRA (Nuclear Reaction Analysis)

International Nuclear Information System (INIS)

Paneta, V.; Axiotis, M.; Lagoyannis, A.; Gastis, P.; Kokkoris, M.; Vlastou, R.; Kontos, A.; Mayer, M.; Misaelides, P.; Perdikakis, G.

2014-01-01

The accurate determination of deuteron depth profile presents a strong analytical challenge for all the principal IBA (Ion Beam Analysis) techniques. As far as NRA (Nuclear Reaction Analysis) is concerned, the 2 H(d,p) reaction, seems to be a promising candidate, especially in the case of complex matrices, or for the study of deep-implanted deuteron layers. In the present work differential cross-section values for the 2 H(d,p) reaction have been determined at 140, 160 and 170 degrees, for E d (lab) = 900-1600 keV, with an energy step of 50 keV, using a well-characterized, thin C:D target deposited on a polished Si wafer. The detection system consisted of 3 silicon surface barrier (SSB) detectors (thickness of 1000 μm) placed at a distance of about 11-13 cm from the target, at the appropriate angles. The experimental results were analyzed using the R-matrix calculations code AZURE. The results, in graphical and tabular form, will soon be available to the scientific community through IBANDL

Ultra-shallow arsenic implant depth profiling using low-energy nitrogen beams

International Nuclear Information System (INIS)

Fearn, Sarah; Chater, Richard; McPhail, David

2004-01-01

Sputtering of silicon by low-energy nitrogen primary ion beams has been studied by a number of authors to characterize the altered layer, ripple formation and the sputtered yields of secondary ions [Surf. Sci. 424 (1999) 299; Appl. Phys. A: Mater. Sci. Process 53 (1991) 179; Appl. Phys. Lett. 73 (1998) 1287]. This study examines the application of low-energy nitrogen primary ion beams for the possible depth profiling of ultra-shallow arsenic implants into silicon. The emphasis of this work is on the matrix silicon signals in the pre-equilibrium surface region that are used for dose calibration. Problems with these aspects of the concentration depth profiling can give significant inconsistencies well outside the error limits of the quoted dose for the arsenic implantation as independently verified by CV profiling. This occurs during depth profiling with either oxygen primary ion beams (with and without oxygen leaks) or cesium primary ion beams

Application of Depth-Averaged Velocity Profile for Estimation of Longitudinal Dispersion in Rivers

Directory of Open Access Journals (Sweden)

Mohammad Givehchi

2010-01-01

Full Text Available River bed profiles and depth-averaged velocities are used as basic data in empirical and analytical equations for estimating the longitudinal dispersion coefficient which has always been a topic of great interest for researchers. The simple model proposed by Maghrebi is capable of predicting the normalized isovel contours in the cross section of rivers and channels as well as the depth-averaged velocity profiles. The required data in Maghrebi’s model are bed profile, shear stress, and roughness distributions. Comparison of depth-averaged velocities and longitudinal dispersion coefficients observed in the field data and those predicted by Maghrebi’s model revealed that Maghrebi’s model had an acceptable accuracy in predicting depth-averaged velocity.

Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon

International Nuclear Information System (INIS)

Gillen, Greg; Batteas, James; Michaels, Chris A.; Chi, Peter; Small, John; Windsor, Eric; Fahey, Albert; Verkouteren, Jennifer; Kim, K.J.

2006-01-01

A C 60 + primary ion source has been coupled to an ion microscope secondary ion mass spectrometry (SIMS) instrument to examine sputtering of silicon with an emphasis on possible application of C 60 + depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials. Unexpectedly, C 60 + SIMS depth profiling of silicon was found to be complicated by the deposition of an amorphous carbon layer which buries the silicon substrate. Sputtering of the silicon was observed only at the highest accessible beam energies (14.5 keV impact) or by using oxygen backfilling. C 60 + SIMS depth profiling of As delta-doped test samples at 14.5 keV demonstrated a substantial (factor of 5) degradation in depth resolution compared to Cs + SIMS depth profiling. This degradation is thought to result from the formation of an unusual platelet-like grain structure on the SIMS crater bottoms. Other unusual topographical features were also observed on silicon substrates after high primary ion dose C 60 + bombardment

Ion-beam-induced topography and compositional changes in depth profiling

International Nuclear Information System (INIS)

Carter, G.; Nobes, M.J.

1992-01-01

When energetic ions penetrate and stop in solids they not only add a new atomic constituent to the matrix but they also create atomic recoils and defects. The fluxes of these entities can give rise to spatial redistribution of atomic components, which may be partly or completely balanced by reordering and relaxation processes. These latter, in turn, may be influenced by fields and gradients induced by the primary relocation processes and by the energy deposited. These will include quasi-thermal, concentration (or chemical potential) and electrostatic gradients and may act to enhance or suppress atomic redistribution. Some, or all, of these processes will operate, depending upon the system under study, when energetic ions are employed to sputter erode a substrate for depth sectioning and, quite generally, can perturb the atomic depth profile that it is intended to evaluate. Theoretical and computational approaches to modelling such processes will be outlined and experimental examples shown which illustrate specific phenomena. In particular the accumulation of implant species and defect generation or redistribution can modify, with increasing ion fluence, the local sputtering mechanism and create further problems in depth profile analysis as a changing surface topography penetrates the solid. Examples of such topographic evolution and its influence on depth profiling analysis will be given and models to explain general and specific behaviour will be outlined. The commonality of models which examine both depth-dependent composition modification and surface topography evolution will be stressed. (author)

Interpreting Repeated Temperature-Depth Profiles for Groundwater Flow

NARCIS (Netherlands)

Bense, Victor F.; Kurylyk, Barret L.; Daal, van Jonathan; Ploeg, van der Martine J.; Carey, Sean K.

2017-01-01

Temperature can be used to trace groundwater flows due to thermal disturbances of subsurface advection. Prior hydrogeological studies that have used temperature-depth profiles to estimate vertical groundwater fluxes have either ignored the influence of climate change by employing steady-state

Secondary neutral mass spectrometry depth profile analysis of silicides

International Nuclear Information System (INIS)

Beckmann, P.; Kopnarski, M.; Oechsner, H.

1985-01-01

The Direct Bombardment Mode (DBM) of Secondary Neutral Mass Spectrometry (SNMS) has been applied for depth profile analysis of two different multilayer systems containing metal silicides. Due to the extremely high depth resolution obtained with low energy SNMS structural details down to only a few atomic distances are detected. Stoichiometric information on internal oxides and implanted material is supplied by the high quantificability of SNMS. (Author)

A new method for depth profiling reconstruction in confocal microscopy

Science.gov (United States)

Esposito, Rosario; Scherillo, Giuseppe; Mensitieri, Giuseppe

2018-05-01

Confocal microscopy is commonly used to reconstruct depth profiles of chemical species in multicomponent systems and to image nuclear and cellular details in human tissues via image intensity measurements of optical sections. However, the performance of this technique is reduced by inherent effects related to wave diffraction phenomena, refractive index mismatch and finite beam spot size. All these effects distort the optical wave and cause an image to be captured of a small volume around the desired illuminated focal point within the specimen rather than an image of the focal point itself. The size of this small volume increases with depth, thus causing a further loss of resolution and distortion of the profile. Recently, we proposed a theoretical model that accounts for the above wave distortion and allows for a correct reconstruction of the depth profiles for homogeneous samples. In this paper, this theoretical approach has been adapted for describing the profiles measured from non-homogeneous distributions of emitters inside the investigated samples. The intensity image is built by summing the intensities collected from each of the emitters planes belonging to the illuminated volume, weighed by the emitters concentration. The true distribution of the emitters concentration is recovered by a new approach that implements this theoretical model in a numerical algorithm based on the Maximum Entropy Method. Comparisons with experimental data and numerical simulations show that this new approach is able to recover the real unknown concentration distribution from experimental profiles with an accuracy better than 3%.

Molecular depth profiling of trehalose using a C{sub 60} cluster ion beam

Energy Technology Data Exchange (ETDEWEB)

Wucher, Andreas [Department of Physics, University of Duisburg-Essen, D-47048 Duisburg (Germany)], E-mail: andreas.wucher@uni-due.de; Cheng Juan; Winograd, Nicholas [Department of Chemistry, Pennsylvania State University, University Park, PA 16802 (United States)

2008-12-15

Molecular depth profiling of organic overlayers was performed using a mass selected fullerene ion beam in conjunction with time-of-flight (TOF-SIMS) mass spectrometry. The characteristics of depth profiles acquired on a 300-nm trehalose film on Si were studied as a function of the impact kinetic energy and charge state of the C{sub 60} projectile ions. We find that the achieved depth resolution depends only weakly upon energy.

Tritium depth profiling by AMS in carbon samples from fusion experiments

International Nuclear Information System (INIS)

Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.

2001-01-01

Tritium depth profiling measurements by accelerator mass spectrometry have been performed at a facility installed at the Rossendorf 3 MV Tandetron. In order to achieve an uniform erosion at the target surface inside of a commercial Cs ion sputtering source and to avoid edge effects, the samples were mechanically scanned inside of a commercial Cs sputter ion source. The sputtered negative ions were mass analysed by the injection magnet of the Tandetron. The tritium ions are counted after the acceleration with semiconductor detectors. Depth profiles have been measured for carbon samples which had been exposed to the plasma at the first wall of the Garching fusion experiment ASDEX-Upgrade and from the European fusion experiment JET, Culham/UK. A dedicated AMS facility with an air-insulated 100 kV tandem accelerator for depth profiling measurements at samples with high tritium concentration is under construction. First results of test operation are presented. (orig.)

Ultra-low energy Ar+ beam applied for SIMS depth profile analysis of layered nanostructures

International Nuclear Information System (INIS)

Konarski, P.; Mierzejewska, A.; Iwanejko, I.

2001-01-01

Secondary ion mass spectrometry (SIMS) depth profile analyses of flat layered nanostructures: 10 nm Ta 2 O 3 /Ta and 20 nm (10 x B 4 C/Mo)/Si as well as microparticles of core (illite) - shell (rutile) structure, performed with the use of ultra-low energy ion beam (180-880 eV, Ar + ), are presented. The profiles were obtained using 'mesa' scanning technique and also sample rotation. Depth profile resolution below 1 nanometer was obtained for flat nanostructures. Presented experimental results are compared with Monte Carlo sputtering simulations of analysed structures. A method of finding beam energy, optimal for the best resolution SIMS depth profile analysis, is suggested. (author)

Quantitative operando visualization of the energy band depth profile in solar cells.

Science.gov (United States)

Chen, Qi; Mao, Lin; Li, Yaowen; Kong, Tao; Wu, Na; Ma, Changqi; Bai, Sai; Jin, Yizheng; Wu, Dan; Lu, Wei; Wang, Bing; Chen, Liwei

2015-07-13

The energy band alignment in solar cell devices is critically important because it largely governs elementary photovoltaic processes, such as the generation, separation, transport, recombination and collection of charge carriers. Despite the expenditure of considerable effort, the measurement of energy band depth profiles across multiple layers has been extremely challenging, especially for operando devices. Here we present direct visualization of the surface potential depth profile over the cross-sections of operando organic photovoltaic devices using scanning Kelvin probe microscopy. The convolution effect due to finite tip size and cantilever beam crosstalk has previously prohibited quantitative interpretation of scanning Kelvin probe microscopy-measured surface potential depth profiles. We develop a bias voltage-compensation method to address this critical problem and obtain quantitatively accurate measurements of the open-circuit voltage, built-in potential and electrode potential difference.

Tritium depth profiling in carbon samples from fusion experiments

International Nuclear Information System (INIS)

Friedrich, M.; Pilz, W.; Sun, G.; Behrisch, R.; Garcia-Rosales, C.; Bekris, N.; Penzhorn, R.-D.

2000-01-01

Tritium depth profiling by accelerator mass spectrometry has been performed at the Rossendorf 3 MV Tandetron. Tritium particles are counted after the accelerator using a semiconductor detector, while deuterium and other light elements are simultaneously measured with the Faraday cup between the injection magnet and the accelerator. Depth profiles have been measured in carbon samples cut from the first wall tiles of the Garching fusion experiment ASDEX-Upgrade and of the European fusion experiment JET, Culham/UK. Tritium contents in the JET samples were up to six orders higher than in samples from ASDEX-Upgrade. Tritium beam currents from samples with high tritium content were measured partly in the Faraday cup before the accelerator. A dedicated tritium AMS facility with an air-insulated 100 kV tandem accelerator is under construction

Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling

Science.gov (United States)

Willingham, D; Brenes, D. A.; Wucher, A

2009-01-01

Molecular depth profiles of an organic thin film of guanine vapor deposited onto a Ag substrate are obtained using a 40 keV C60 cluster ion beam in conjunction with time-of-flight secondary ion mass spectrometric (ToF-SIMS) detection. Strong-field, femtosecond photoionization of intact guanine molecules is used to probe the neutral component of the profile for direct comparison with the secondary ion component. The ability to simultaneously acquire secondary ions and photoionized neutral molecules reveals new fundamental information about the factors that influence the properties of the depth profile. Results show that there is an increased ionization probability for protonated molecular ions within the first 10 nm due to the generation of free protons within the sample. Moreover, there is a 50% increase in fragment ion signal relative to steady state values 25 nm before reaching the guanine/Ag interface as a result of interfacial chemical damage accumulation. An altered layer thickness of 20 nm is observed as a consequence of ion beam induced chemical mixing. In general, we show that the neutral component of a molecular depth profile using the strong-field photoionization technique can be used to elucidate the effects of variations in ionization probability on the yield of molecular ions as well as to aid in obtaining accurate information about depth dependent chemical composition that cannot be extracted from TOF-SIMS data alone. PMID:20495665

Depth profiling by Raman spectroscopy of high-energy ion irradiated silicon carbide

Energy Technology Data Exchange (ETDEWEB)

Wang, Xu; Zhang, Yanwen; Liu, Shiyi; Zhao, Ziqiang, E-mail: zqzhao@pku.edu.cn

2014-01-15

Single crystals of 6H–SiC were irradiated at room temperature with 20 MeV carbon ions at fluences of 1.5 × 10{sup 15} and 6.0 × 10{sup 15} cm{sup −2}. Raman measurements were performed to study irradiation induced damage and the in-depth damage profile of SiC. A clear change of damage from the surface down to the stopping region of carbon ions as simulated by SRIM is exhibited. The affected area as detected by Raman is in good agreement with SRIM predictions while a little shallower dpa profile is observed. The partial disorder defined in the present work as a function of depth is demonstrated. A shift of the position of the TO peak towards lower wavenumbers with in-depth damage and then to higher wavenumbers beyond the most damaged region indicates that tensile strain due to defects has a backward V-curve distribution. The damaged layer is subjected to a compressive in-plane stress associated with the out-of-plane strain and the magnitude of this stress also has a backward V-curve depth profile. The evolution of line width of the TO peak with depth clearly shows the density of defects reaches the higher level at the most damaged region. The Raman spectroscopy scanning technique is proved to be a powerful tool for profiling of crystal damage induced by high-energy ion implantation.

Statistically sound evaluation of trace element depth profiles by ion beam analysis

International Nuclear Information System (INIS)

Schmid, K.; Toussaint, U. von

2012-01-01

This paper presents the underlying physics and statistical models that are used in the newly developed program NRADC for fully automated deconvolution of trace level impurity depth profiles from ion beam data. The program applies Bayesian statistics to find the most probable depth profile given ion beam data measured at different energies and angles for a single sample. Limiting the analysis to % level amounts of material allows one to linearize the forward calculation of ion beam data which greatly improves the computation speed. This allows for the first time to apply the maximum likelihood approach to both the fitting of the experimental data and the determination of confidence intervals of the depth profiles for real world applications. The different steps during the automated deconvolution will be exemplified by applying the program to artificial and real experimental data.

Photothermal depth profiling for multilayered Structures by particle swarm optimization

International Nuclear Information System (INIS)

Chen, Z J; Fang, J W; Zhang, S Y

2011-01-01

This paper presents a method to reconstruct thermal conductivity depth profile of a layered medium using noisy photothermal data. The method tries to obtain an accurate reconstruction of discontinuous profile using particle swarm optimization (PSO) algorithm and total variation (TV) regularization. The reconstructions of different thermal conductivity profiles have been tested on simulated photothermal data. The simulation results show that the method can find accurately the locations of discontinuities, and the reconstructed profiles are in agreement with the original ones. Moreover, the results also show the method has good robustness and anti-noise capability.

Ion induced optical emission for surface and depth profile analysis

International Nuclear Information System (INIS)

White, C.W.

1977-01-01

Low-energy ion bombardment of solid surfaces results in the emission of infrared, visible, and ultraviolet radiation produced by inelastic ion-solid collision processes. The emitted optical radiation provides important insight into low-energy particle-solid interactions and provides the basis for an analysis technique which can be used for surface and depth profile analysis with high sensitivity. The different kinds of collision induced optical radiation emitted as a result of low-energy particle-solid collisions are reviewed. Line radiation arising from excited states of sputtered atoms or molecules is shown to provide the basis for surface and depth profile analysis. The spectral characteristics of this type of radiation are discussed and applications of the ion induced optical emission technique are presented. These applications include measurements of ion implant profiles, detection sensitivities for submonolayer quantities of impurities on elemental surfaces, and the detection of elemental impurities on complex organic substrates

Depth profiling: RBS versus energy-dispersive X-ray imaging using scanning transmission electron microscopy

International Nuclear Information System (INIS)

Markwitz, Andreas

2000-01-01

Rutherford backscattering spectrometry (RBS) is known to be one of the techniques ideal for analysis of thin films. Elemental concentrations of matrix components and impurities can be investigated as well as depth profiles of almost each element of the periodic table. Best of all, RBS has both a high sensitivity and a high depth resolution, and is a non-destructive analysis technique that does not require specific sample preparation. Solid-state samples are mounted without preparation inside a high-vacuum analysis chamber. However, depth-related interpretation of elemental depth profiles requires the material density of the specimen and stopping power values to be taken into consideration. In many cases, these parameters can be estimated with sufficient precision. However, the assumed density can be inaccurate for depth scales in the nanometer range. For example, in the case of Ge nanoclusters in 500 nm thick SiO 2 layers, uncertainty is related to the actual position of a very thin Ge nanocluster band. Energy-dispersive X-ray emission (EDX) spectroscopy, using a high-resolution scanning transmission electron microscope (STEM) can assist in removing this uncertainty. By preparing a thin section of the specimen, EDX can be used to identify the position of the Ge nanocluster band very precisely, by correlating the Ge profile with the depth profiles of silicon and oxygen. However, extraction of the concentration profiles from STEM-EDX spectra is in general not straightforward. Therefore, a combination of the two very different analysis techniques is often the best and only successful way to extract high-resolution concentration profiles

Fluence dependence of disorder depth profiles in Pb implanted Si

International Nuclear Information System (INIS)

Christodoulides, C.E.; Kadhim, N.J.; Carter, G.

1980-01-01

The total, depth integrated disorder, induced by Pb implantation into Si at room temperature, initially increases rapidly with implantation fluence and then reaches a quasi saturation level where the increase with fluence is slow. Measurements of the depth distributions of the disorder, using high resolution low angle exit Rutherford Backscattering/Channelling analysis, suggest that the quasi saturation results from overlapping of disordered zones generated deep in the tail of the disorder-depth profiles. The depth of the disordered solid-crystal boundary, xsub(D), increases with ion fluence PHI, according to the relation xsub(D) = x bar + f(PHI).σ, where x bar is the most probable projected depth and σ the projected standard deviation of disorder generation. It is shown that this relationship is consistent with an approximately Gaussian depth distribution of disorder production. (author)

Reconstruction of original indium distribution in InGaAs quantum wells from experimental SIMS depth profiles

Energy Technology Data Exchange (ETDEWEB)

Kudriavtsev, Yu., E-mail: yuriyk@cinvestav.mx [Departamento Ingeniería Eléctrica – SEES, CINVESTAV-IPN, Av. IPN #2508, D.F., México (Mexico); Asomoza, R. [Departamento Ingeniería Eléctrica – SEES, CINVESTAV-IPN, Av. IPN #2508, D.F., México (Mexico); Gallardo-Hernandez, S.; Ramirez-Lopez, M.; Lopez-Lopez, M. [Departamento de Física, CINVESTAV-IPN, México (Mexico); Nevedomsky, V.; Moiseev, K. [Ioffe Physical Technical Institute, S-Petersburg (Russian Federation)

2014-11-15

Depth profiling analysis of InGaAs/GaAs hetero-structures grown by MBE on GaAs (0 0 1) substrates is reported. A novel two-step procedure for de-convolving experimental SIMS depth distribution is employed and the original In distribution in InGaAs quantum wells (QW) is estimated. The QW thickness calculated from the de-convolved profiles is shown to be in good agreement with the cross-sectional TEM images. The experimental In depth profile is shifted from the original In distribution due to the ion mixing process during depth profiling analysis. It is shown that the de-convolution procedure is suitable for reconstruction of the original QW width and depth by SIMS even for relatively high primary ion energies.

Photothermal radiometric determination of thermal diffusivity depth profiles in a dental resin

International Nuclear Information System (INIS)

MartInez-Torres, P; Alvarado-Gil, J J; Mandelis, A

2010-01-01

The depth of curing due to photopolymerization in a commercial dental resin is studied using photothermal radiometry. The sample consists of a thick layer of resin on which a thin metallic layer is deposited guaranteeing full opacity of the sample. In this case, purely thermal-wave inverse problem techniques without the interference of optical profiles can be used. Thermal profiles are obtained by heating the coating with a modulated laser beam and performing a modulation frequency scan. Before each frequency scan, photopolymerization was induced using a high power blue LED. However due to the fact that dental resins are highly light dispersive materials, the polymerization process depends strongly on the optical absorption coefficient inducing a depth dependent thermal diffusion in the sample. It is shown that using a robust depth profilometric inverse method one can reconstruct the thermal diffusivity profile of the photopolymerized resin.

Nondestructive strain depth profiling with high energy X-ray diffraction: System capabilities and limitations

Science.gov (United States)

Zhang, Zhan; Wendt, Scott; Cosentino, Nicholas; Bond, Leonard J.

2018-04-01

Limited by photon energy, and penetration capability, traditional X-ray diffraction (XRD) strain measurements are only capable of achieving a few microns depth due to the use of copper (Cu Kα1) or molybdenum (Mo Kα1) characteristic radiation. For deeper strain depth profiling, destructive methods are commonly necessary to access layers of interest by removing material. To investigate deeper depth profiles nondestructively, a laboratory bench-top high-energy X-ray diffraction (HEXRD) system was previously developed. This HEXRD method uses an industrial 320 kVp X-Ray tube and the Kα1 characteristic peak of tungsten, to produces a higher intensity X-ray beam which enables depth profiling measurement of lattice strain. An aluminum sample was investigated with deformation/load provided using a bending rig. It was shown that the HEXRD method is capable of strain depth profiling to 2.5 mm. The method was validated using an aluminum sample where both the HEXRD method and the traditional X-ray diffraction method gave data compared with that obtained using destructive etching layer removal, performed by a commercial provider. The results demonstrate comparable accuracy up to 0.8 mm depth. Nevertheless, higher attenuation capabilities in heavier metals limit the applications in other materials. Simulations predict that HEXRD works for steel and nickel in material up to 200 µm, but experiment results indicate that the HEXRD strain profile is not practical for steel and nickel material, and the measured diffraction signals are undetectable when compared to the noise.

3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures

Energy Technology Data Exchange (ETDEWEB)

Hourani, W. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Gorbenko, V. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Univ. Grenoble Alpes, LTM, CNRS, F-38000 Grenoble (France); Barnes, J.-P.; Guedj, C. [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France); Cipro, R.; Moeyaert, J.; David, S.; Bassani, F.; Baron, T. [Univ. Grenoble Alpes, LTM, CNRS, F-38000 Grenoble (France); Martinez, E., E-mail: eugenie.martinez@cea.fr [Univ. Grenoble Alpes, F-38000 Grenoble (France); CEA, LETI, MINATEC Campus, F-38054 Grenoble (France)

2016-11-15

Highlights: • The nanoscale chemical characterization of III–V heterostructures is performed using Auger depth profiling below decananometric spatial resolution. • Reliable indium quantification is achieved on planar structures for thicknesses down to 9 nm. • Quantitative 3D compositional depth profiles are obtained on patterned structures, with sufficient lateral resolution to analyze one single trench. • The Auger intrinsic spatial resolution is estimated around 150–200 nm using a comparison with HAADF-STEM. • Auger and SIMS provide reliable in-depth chemical analysis of such complex 3D heterostructures, in particular regarding indium quantification. - Abstract: The nanoscale chemical characterization of III–V heterostructures is performed using Auger depth profiling below decananometric spatial resolution. This technique is successfully applied to quantify the elemental composition of planar and patterned III–V heterostructures containing InGaAs quantum wells. Reliable indium quantification is achieved on planar structures for thicknesses down to 9 nm. Quantitative 3D compositional depth profiles are obtained on patterned structures, for trench widths down to 200 nm. The elemental distributions obtained in averaged and pointed mode are compared. For this last case, we show that Zalar rotation during sputtering is crucial for a reliable indium quantification. Results are confirmed by comparisons with secondary ion mass spectrometry, photoluminescence spectroscopy, transmission electron microscopy and electron dispersive X-ray spectroscopy. The Auger intrinsic spatial resolution is quantitatively measured using an original methodology based on the comparison with high angle annular dark field scanning transmission electron microscopy measurements at the nanometric scale.

Element depth profiles of porous silicon

International Nuclear Information System (INIS)

Kobzev, A.P.; Nikonov, O.A.; Kulik, M.; Zuk, J.; Krzyzanowska, H.; Ochalski, T.J.

1997-01-01

Element depth profiles of porous silicon were measured on the Van-de-Graaff accelerator in the energy range of 4 He + ions from 2 to 3.2 MeV. Application of complementary RBS, ERD and 16 O(α,α) 16 O nuclear reaction methods permits us to obtain: 1) the exact silicon, oxygen and hydrogen distribution in the samples, 2) the distribution of partial pore concentrations. The oxygen concentration in porous silicon reaches 30%, which allows one to assume the presence of silicon oxide in the pores and to explain the spectrum shift of luminescence into the blue area

Purification and Characterization of a Thermostable Lipase from Geobacillus thermodenitrificans IBRL-nra

Directory of Open Access Journals (Sweden)

Anuradha Balan

2012-01-01

Full Text Available Thermostable lipase from Geobacillus thermodenitrificans IBRL-nra was purified and characterized. The production of thermostable lipase from Geobacillus thermodenitrificans IBRL-nra was carried out in a shake-flask system at 65°C in cultivation medium containing; glucose 1.0% (w/v; yeast extract 1.25% (w/v; NaCl 0.45% (w/v olive oil 0.1% (v/v with agitation of 200 rpm for 24 hours. The extracted extracellular crude thermostable lipase was purified to homogeneity by using ultrafiltration, Heparin-affinity chromatography, and Sephadex G-100 gel-filtration chromatography by 34 times with a final yield of 9%. The molecular weight of the purified enzyme was estimated to be 30 kDa after SDS-PAGE analysis. The optimal temperature for thermostable lipase was 65°C and it retained its initial activity for 3 hours. Thermostable lipase activity was highest at pH 7.0 and stable for 16 hours at this pH at 65°C. Thermostable lipase showed elevated activity when pretreated with BaCl2, CaCl2, and KCl with 112%, 108%, and 106%, respectively. Lipase hydrolyzed tripalmitin (C16 and olive oil with optimal activity (100% compared to other substrates.

Non destructive method of determination of depth profiling with ESCA spectroscopy by angular distribution

International Nuclear Information System (INIS)

Pijolat, Michele.

1979-07-01

The aim of this study has been to determine the possibilities of photoelectron spectroscopy ESCA for depth profiling in the first hundred angstrom of a compound. First of all, the technique ESCA has been described in an analytical point of view. Then, the common sputter profiling method has been tested, and a model to deduce the concentrations profile has been formulated. However the analysis of the various effects due to the sputtering events showed that this method is able to give only the profile shape with a bad depth resolution. A new non destructive method based on the analysed depth dependence with photoelectrons emission angle is settled. A computational method (simplexe optimization) is used to deduce the concentrations profile. Simulation have revealed the necessity of submitting constraints proper to the system physical properties and allowed to state the applicability range of the method. The interface profiles Ag-Pd, Ag-Al 2 O 3 and SiO 2 -Si have been measured, and the surface segregation in CuNi alloy has been studied [fr

Pulsed glow discharge mass spectrometry for molecular depth profiling of polymers

International Nuclear Information System (INIS)

Lobo, L.; Pereiro, R.; Sanz-Medel, A.; Bordel, N.; Pisonero, J.; Licciardello, A.; Tuccitto, N.; Tempez, A.; Chapon, P.

2009-01-01

Full text: Nowadays thin films of polymeric materials involve a wide range of industrial applications, so techniques capable of providing in-depth profile information are required. Most of the techniques available for this purpose are based on the use of energetic particle beams which interact with polymers producing undesirable physicochemical modifications. Radiofrequency pulsed glow discharge (rf-pulsed-GD) coupled to time-of-flight mass spectrometry (TOFMS) could afford the possibility of acquiring both elemental and molecular information creating minimal damage to surfaces and thereby obtaining depth profiles. This work will evaluate rf-GDs coupled to an orthogonal TOFMS for direct analysis of polymers. (author)

Numerical and experimental depth profile analyses of coated and attached layers by laser-induced breakdown spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Ardakani, H. Afkhami [Laser and Plasma Research Institute, Shahid Beheshti University, G. C., Evin, Tehran (Iran, Islamic Republic of); Tavassoli, S.H., E-mail: h-tavassoli@sbu.ac.i [Laser and Plasma Research Institute, Shahid Beheshti University, G. C., Evin, Tehran (Iran, Islamic Republic of)

2010-03-15

Laser-induced breakdown spectroscopy (LIBS) is applied for depth profile analysis of different thicknesses of copper foils attached on steel and aluminum substrates. In order to account interfacial effects, depth profile analysis of copper coated on steel is also carried out. Experiments are done at ambient air and at two different wavelengths of 266 and 1064 nm of a Nd:YAG laser with pulse durations of 5 ns. A three-dimensional model of multi-pulse laser ablation is introduced on the base of normal evaporation mechanism and the simulation results are compared with the experiments. A normalized concentration (C{sup N}) is introduced for determination of interface position and results are compared with the usually used normalized intensity (I{sup N}). The effect of coating thickness on average ablation rate and resolution of depth profiling are examined. There is a correlation coefficient higher than 0.95 between the model and experimental depth profiles based on the C{sup N} method. Depth profile analysis on the base of C{sup N} method shows a better depth resolution in comparison with I{sup N} method .Increase in the layer thickness, leads to a decrease in the ablation rate.

Model for hydrogen isotope backscattering, trapping and depth profiles in C and a-Si

International Nuclear Information System (INIS)

Cohen, S.A.; McCracken, G.M.

1979-03-01

A model of low energy hydrogen trapping and backscattering in carbon and a-silicon is described. Depth profiles are calculated and numerical results presented for various incident angular and energy distributions. The calculations yield a relation between depth profiles and the incident ion energy distribution. The use of this model for tokamak plasma diagnosis is discussed

A small and compact AMS facility for tritium depth profiling

Indian Academy of Sciences (India)

employing diamond-like carbon (DLC) stripper foils at this accelerator, another ... the switching magnet the tritium ions are counted with a surface barrier detector. .... AMS has been successfully applied to depth profiling of tritium in graphite ...

Accurate depth profiling for ultra-shallow implants using backside-SIMS

International Nuclear Information System (INIS)

Hongo, Chie; Tomita, Mitsuhiro; Takenaka, Miyuki

2004-01-01

We studied methods for accurate depth profiling for ultra-shallow implants using backside-SIMS. For the measurement of ultra-shallow profiles, the effects of surface transient and atomic mixing are not negligible. Therefore, we applied backside-SIMS to analyze ultra-shallow doping in order to exclude these effects. Backside-SIMS profiles show a sharper ion implantation tail than surface-side-SIMS profiles. In addition, the primary ion energy dependence becomes weaker when backside-SIMS is used [Surf. Interf. Anal. 29 (2000) 362; Appl. Surf. Sci. 203-204 (2003) 264; J. Vac. Sci. Technol. B 21 (2003) 1422]. However, the peak concentration of the backside sample was lower than that of the surface-side sample. Therefore, the sample flatness was estimated using the SIMS response function. Furthermore, SIMS profiles were simulated using SIMS response functions. This simulation shows how the sample flatness affects the SIMS profile

Metrology aspects of SIMS depth profiling for advanced ULSI processes

International Nuclear Information System (INIS)

Budrevich, Andre; Hunter, Jerry

1998-01-01

As the semiconductor industry roadmap passes through the 0.1 μm technology node, the junction depth of the transistor source/drain extension will be required to be less than 20 nm and the well doping will be near 1.0 μm in depth. The development of advanced ULSI processing techniques requires the evolution of new metrology tools to ensure process capability. High sensitivity (ppb) coupled with excellent depth resolution (1 nm) makes SIMS the technique of choice for measuring the in-depth chemical distribution of these dopants with high precision and accuracy. This paper will discuss the issues, which impact the accuracy and precision of SIMS measurements of ion implants (both shallow and deep). First this paper will discuss common uses of the SIMS technique in the technology development and manufacturing of advanced ULSI processes. In the second part of this paper the ability of SIMS to make high precision measurements of ion implant depth profiles will be studied

Depth-profiling by confocal Raman microscopy (CRM): data correction by numerical techniques.

Science.gov (United States)

Tomba, J Pablo; Eliçabe, Guillermo E; Miguel, María de la Paz; Perez, Claudio J

2011-03-01

The data obtained in confocal Raman microscopy (CRM) depth profiling experiments with dry optics are subjected to significant distortions, including an artificial compression of the depth scale, due to the combined influence of diffraction, refraction, and instrumental effects that operate on the measurement. This work explores the use of (1) regularized deconvolution and (2) the application of simple rescaling of the depth scale as methodologies to obtain an improved, more precise, confocal response. The deconvolution scheme is based on a simple predictive model for depth resolution and the use of regularization techniques to minimize the dramatic oscillations in the recovered response typical of problem inversion. That scheme is first evaluated using computer simulations on situations that reproduce smooth and sharp sample transitions between two materials and finally it is applied to correct genuine experimental data, obtained in this case from a sharp transition (planar interface) between two polymeric materials. It is shown that the methodology recovers very well most of the lost profile features in all the analyzed situations. The use of simple rescaling appears to be only useful for correcting smooth transitions, particularly those extended over distances larger than those spanned by the operative depth resolution, which limits the strategy to the study of profiles near the sample surface. However, through computer simulations, it is shown that the use of water immersion objectives may help to reduce optical distortions and to expand the application window of this simple methodology, which could be useful, for instance, to safely monitor Fickean sorption/desorption of penetrants in polymer films/coatings in a nearly noninvasive way.

Observed damage during Argon gas cluster depth profiles of compound semiconductors

Energy Technology Data Exchange (ETDEWEB)

Barlow, Anders J., E-mail: anders.barlow@ncl.ac.uk; Portoles, Jose F.; Cumpson, Peter J. [National EPSRC XPS Users' Service (NEXUS), School of Mechanical and Systems Engineering, Newcastle University, Newcastle upon Tyne NE1 7RU (United Kingdom)

2014-08-07

Argon Gas Cluster Ion Beam (GCIB) sources have become very popular in XPS and SIMS in recent years, due to the minimal chemical damage they introduce in the depth-profiling of polymer and other organic materials. These GCIB sources are therefore particularly useful for depth-profiling polymer and organic materials, but also (though more slowly) the surfaces of inorganic materials such as semiconductors, due to the lower roughness expected in cluster ion sputtering compared to that introduced by monatomic ions. We have examined experimentally a set of five compound semiconductors, cadmium telluride (CdTe), gallium arsenide (GaAs), gallium phosphide (GaP), indium arsenide (InAs), and zinc selenide (ZnSe) and a high-κ dielectric material, hafnium oxide (HfO), in their response to argon cluster profiling. An experimentally determined HfO etch rate of 0.025 nm/min (3.95 × 10{sup −2} amu/atom in ion) for 6 keV Ar gas clusters is used in the depth scale conversion for the profiles of the semiconductor materials. The assumption has been that, since the damage introduced into polymer materials is low, even though sputter yields are high, then there is little likelihood of damaging inorganic materials at all with cluster ions. This seems true in most cases; however, in this work, we report for the first time that this damage can in fact be very significant in the case of InAs, causing the formation of metallic indium that is readily visible even to the naked eye.

A Study of Storage Ring Requirements for an Explosive Detection System Using NRA Method.

Energy Technology Data Exchange (ETDEWEB)

Wang, T. F. (Tai-Sen F.); Kwan, T. J. T. (Thomas J. T.)

2005-01-01

The technical feasibility of an explosives detection system based on the nuclear resonance absorption (NRA) of gamma rays in nitrogen-rich materials was demonstrated at Los Alamos National Laboratory (LANL) in 1993 by using an RFQ proton accelerator and a tomographic imaging prototype. The study is being continued recently to examine deployment of such an active interrogation system in realistic scenarios. The approach is to use an accelerator and electron-cooling-equipped storage rings(s) to provide the high quality and high current proton beam needed in a practical application. In this work, we investigate the requirements on the storage ring(s) with external gamma-ray-production target for a variant of the airport luggage inspection system considered in the earlier LANL experiments. Estimations are carried out based on the required inspection throughput, the gamma ray yield, the proton beam emittance growth due to scatters with the photon-production target, beam current limit in the storage ring, and the electron-cooling rate. Studies using scaling and reasonable parameter values indicate that it is possible to use no more than a few storage rings per inspection station in a practical NRA luggage inspection complex having more than ten inspection stations.

Pulsed photothermal depth profiling of tattoos undergoing laser removal treatment

Science.gov (United States)

Milanic, Matija; Majaron, Boris

2012-02-01

Pulsed photothermal radiometry (PPTR) allows noninvasive determination of temperature depth profiles induced by pulsed laser irradiation of strongly scattering biological tissues and organs, including human skin. In present study, we evaluate the potential of this technique for investigational characterization and possibly quantitative evaluation of laser tattoo removal. The study involved 5 healthy volunteers (3 males, 2 females), age 20-30 years, undergoing tattoo removal treatment using a Q-switched Nd:YAG laser. There were four measurement and treatment sessions in total, separated by 2-3 months. Prior to each treatment, PPTR measurements were performed on several tattoo sites and one nearby healthy site in each patient, using a 5 ms Nd:YAG laser at low radiant exposure values and a dedicated radiometric setup. The laser-induced temperature profiles were then reconstructed by applying a custom numerical code. In addition, each tatoo site was documented with a digital camera and measured with a custom colorimetric system (in tristimulus color space), providing an objective evaluation of the therapeutic efficacy to be correlated with our PPTR results. The results show that the laser-induced temperature profile in untreated tattoos is invariably located at a subsurface depth of 300 μm. In tattoo sites that responded well to laser therapy, a significant drop of the temperature peak was observed in the profiles obtained from PPTR record. In several sites that appeared less responsive, as evidenced by colorimetric data, a progressive shift of the temperature profile deeper into the dermis was observed over the course of consecutive laser treatments, indicating that the laser tattoo removal was efficient.

Deuterium depth profiles in metals using imaging field desorption

International Nuclear Information System (INIS)

Panitz, J.A.

1976-01-01

Depth profiles of 80 eV deuterium ions implanted in-situ into (110) tungsten have been measured by Imaging, Field-Desorption Mass Spectrometry. The relative abundance of deuterium was measured from the surface to a depth of 300A with less than 3A depth resolution by controlled field-evaporation of the specimen, and time-of-flight mass spectroscopy. The position of the depth distribution maximum (57 +- 3A from the surface) is shown to be in close agreement with that predicted theoretically for low energy deuterium implants using an amorphous-solid model. Structure in the distribution is attributed to surface morphology and channeling phenomena in the near surface region. Implanted impurity species from the ion source and tungsten surface have also been observed. For C + , C 2+ and 0 + , penetration is limited to less than 30A, with abundance decreasing exponentially from the surface. These results are interpreted in the context of the CTR first-wall impurity problem, and are used to suggest a novel method for in-situ characterization of low energy plasma species in operating CTR devices

Depth profile of In and As in Si measured by RBS with He and C ions

Energy Technology Data Exchange (ETDEWEB)

Yang, Q.; Fang, Z. [Newcastle Univ., NSW (Australia). Dept. of Physics; Ophel, T.R. [Australian National Univ., Canberra, ACT (Australia). Dept. of Nuclear Physics

1993-12-31

The depth profile of As and In implanted into Si have been measured by RBS (Rutherford Backscattering Spectrometry) with 2 MeV He ions and 6 MeV C ions. Advantages of enhanced depth and mass resolution with C ions have been demonstrated over the conventional He RBS. More reliable information for the depth profile of In and As in Si has been obtained. 12 refs., 3 figs.

Depth profile of In and As in Si measured by RBS with He and C ions

Energy Technology Data Exchange (ETDEWEB)

Yang, Q; Fang, Z [Newcastle Univ., NSW (Australia). Dept. of Physics; Ophel, T R [Australian National Univ., Canberra, ACT (Australia). Dept. of Nuclear Physics

1994-12-31

The depth profile of As and In implanted into Si have been measured by RBS (Rutherford Backscattering Spectrometry) with 2 MeV He ions and 6 MeV C ions. Advantages of enhanced depth and mass resolution with C ions have been demonstrated over the conventional He RBS. More reliable information for the depth profile of In and As in Si has been obtained. 12 refs., 3 figs.

Nuclear resonance absorption (NRA): method and application to detection of contraband in a baggage, cargo and vehicles

International Nuclear Information System (INIS)

Goldenberg, M.B.; Vartsky, D.; Engler, G.

1996-01-01

Nuclear Resonance Absorption (NRA) has played a prominent role in nuclear spectroscopy for almost 5 decades, but found only few and marginal applications outside the laboratory before 1985. In that year the situation changed markedly when scientists from this laboratory proposed to the Federal Aviation Administration (FAA) in the U.S. to study its suitability for detecting explosives in passenger baggage via nitrogen-specific radiographic imaging (explosives, as a category, have inordinately high nitrogen densities). Following a basic feasibility study and the first laboratory demonstration of explosives detection in 1989, this project has attained the stage of a pre-industrial prototype that exhibited excellent performance characteristics in a 1993 blind test conducted by the FAA. In terms of NRA operational system concept, data taking methodology, development of dedicated detectors and image analysis algorithms, the Soreq group has made a major, if not exclusive, contribution over the years. (authors)

Buoyancy frequency profiles and internal semidiurnal tide turning depths in the oceans

OpenAIRE

King, B.; Stone, M.; Zhang, H.P.; Gerkema, T.; Marder, M.; Scott, R.B.; Swinney, H.L.

2012-01-01

We examine the possible existence of internal gravity wave "turning depths," depths below which the local buoyancy frequency N(z) becomes smaller than the wave frequency. At a turning depth, incident gravity waves reflect rather than reaching the ocean bottom as is generally assumed. Here we consider internal gravity waves at the lunar semidiurnal (M-2) tidal frequency, omega(M2). Profiles of N-2(z) (the quantity in the equations of motion) are computed using conductivity, temperature, and de...

SIMS depth profile analysis of environmental microparticles

International Nuclear Information System (INIS)

Konarski, P.

2000-01-01

Environmental and technological research demands chemical characterization of aerosol particles so minute in size, that conventional methods for bulk analyses are simply not applicable. In this work novel application of secondary ion mass spectrometry (SIMS) for characterization of microparticles suspended in atmosphere of the working environment of glass plant Thomson Polkolor, Piaseczno and steelworks Huta Sendzimira, Cracow is presented. The new technique based on sample rotation in depth profile analysis of sub-micrometer particulate material was performed on SAJW-02 analyser equipped with Balzers 16 mm quadrupole spectrometer and sample rotation manipulator using 5 keV Ar + and O 2 + ion beams. The results were compared with the standard method used on ims-3f Cameca analyser 12 keV O 2 + ion beam. Grain size distributions of aerosol microparticles were estimated using eight-stage cascade impactor with particle size range of 0.2 μm to 15 μm. Elemental concentration and crystalline structure of the collected dust particles were performed using spark source mass spectrometry and X-ray diffraction methods. SIMS depth profile analysis shows that sub-micrometer particles do not have uniform morphology, The core-shell structure has been observed for particles collected in both factories. Presented models show that the steelworks particles consists mainly of iron and manganese cores. At the shells of these microparticles :lead, chlorine and fluorine are found. The cores of glass plant submicrometer particles consists mainly of lead-zirconium glass covered by a shell containing carbon and copper. Sample rotation technique applied SIMS appears to be an effective tool for environmental microparticle morphology studies. (author)

Characterization of polymer solar cells by TOF-SIMS depth profiling

NARCIS (Netherlands)

Bulle-Lieuwma, C.W.T.; Gennip, van W.J.H.; Duren, van J.K.J.; Jonkheijm, P.; Janssen, R.A.J.; Niemantsverdriet, J.W.

2003-01-01

Solar cells consisting of polymer layers sandwiched between a transparent electrode on glass and a metal top electrode are studied using dynamic time-of-flight secondary ion mass spectrometry (TOF-SIMS) in dual-beam mode. Because depth profiling of polymers and polymer-metal stacks is a relatively

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Energy Technology Data Exchange (ETDEWEB)

Mahoney, Christine M. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)]. E-mail: christine.mahoney@nist.gov; Fahey, Albert J. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Gillen, Greg [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Xu Chang [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States); Batteas, James D. [National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, MD, 20899 (United States)

2006-07-30

Secondary ion mass spectrometry (SIMS) employing an SF{sub 5} {sup +} polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from -125 deg. C to 150 deg. C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced interfacial widths as compared to analysis at ambient temperature. Atomic force microscopy (AFM) images indicated that this improvement in interfacial width may be related to a decrease in sputter-induced topography. Depth profiling at higher temperatures was typically correlated with increased sputter rates. However, the improvements in interfacial widths and overall secondary ion stability were not as prevalent as was observed at low temperature. For PLA, improvements in signal intensities were observed at low temperatures, yet there was no significant change in secondary ion stability, interface widths or sputter rates. High temperatures yielded a significant decrease in secondary ion stability of the resulting profiles. PS films showed rapid degradation of characteristic secondary ion signals under all temperatures examined.

The Effects of Dose Rhizoctonia Binucleat (BNR and Phosphorus to Nitrate Reductase Activity (NRA and Chlorophyll of Vanilla Seedling (Vanilla planifolia Andrews

Directory of Open Access Journals (Sweden)

Haryuni Haryuni

2016-09-01

Full Text Available Vanilla (Vanilla planifolia Andrews is one of the important exported commodities in Indonesia. Indonesia is one of top five major vanilla exporters in the world, that produce the high quality of Indonesian vanilla with high vanillin content (2.75%. The aims of this research were to determine the effects of dose binukleat Rhizoctonia (BNR and phosphorus as well as the interaction of the nitrate reductase activity (NRA and chlorophyll of the vanilla seedling (Vanilla planifolia Andrew. Method in this research used completely randomized factorial design, by involving two factors (dose of BNR inoculation and Phosphor. The first factor is without inoculation and inoculation BNR (M0, M1, M2, M3 wich consists of (0,5, 10, 15 g/polybag, the second factor is the dose of phosphorus fertilizer (P0, P1, P2, P3 which consists of (0, 3, 6, 9 g/polibag. The results showed that the inoculation dose of BNR and doses of phosphorus not significant and lower levels of NRA and chlorophyll while the interaction dose of BNR and phosphorus significantly and increase levels of NRA and chlorophyll of vanilla seedling. Nitrate Reductase Activity and chlorophyll has important role in metabolism process as a plant growth indicator.How to CiteHaryuni, H., & Dewi, T. S. K. (2016. The Effects of Dose Rhizoctonia Binucleat (BNR and Phosphorus to Nitrate Reductase Activity (NRA and Chlorophyll of Vanilla Seedling (Vanilla planifolia Andrews. Biosaintifika: Journal of Biology & Biology Education, 8(2, 141-147.

Factors that influence an elemental depth concentration profile

International Nuclear Information System (INIS)

McHugh, J.A.

1975-01-01

The use of secondary ion mass spectrometry in concentration profiling is discussed. Two classes of factors that influence an elemental concentration profile are instrumental effects and ion-matrix effects. Instrumental factors that must be considered are: (1) uniformity of the primary ion current density, (2) constancy of the primary ion current, (3) redeposition, (4) memory, (5) primary ion beam tailing and the nonfocused component, (6) chemical purity of the primary ion beam, and (7) residual gas impurities. Factors which can be classified as ion matrix effects are: (1) the mean escape depth of secondary ions, (2) recoil implantation, (3) molecular ion interferences, (4) primary ion beam induced diffusion of matrix species, (5) nonuniform sputter removal of matrix layers, and (6) implanted primary ion chemical and lattice damage effects

Ion implantation artifacts observed in depth profiling boron in silicon by secondary ion mass spectrometry

International Nuclear Information System (INIS)

Chi, P.; Simons, D.S.

1987-01-01

A comparison study of depth profiling by secondary ion mass spectrometry (SIMS) and neutron depth profiling (NDP) was recently conducted. The specimens were portions of 5 cm diameter single crystal silicon slices in which B-10 had been implanted at various fluences and energies. NDP measurements were made on a 13 mm diameter area at the center of the wafers. SIMS measurements were taken from a 60 μm diameter area approximately 16 mm from the center of the wafer. One observation that emerged from this work was an apparent discrepancy between the profiles of B-10 measured by DNP and SIMS. The peaks of the SIMS profiles were typically deeper than those of NDP by as much as 30 nm, which is 10% of the projected range for a 70 keV implant. Moreover, the profiles could not be made to coincide by either a constant shift or a proportional change of one depth scale with respect to the other. The lateral inhomogeneity of boron that these experiments have demonstrated arises from the variable contribution of ion channeling during implantation

Effects of Shear Fracture on In-depth Profile Modification of Weak Gels

Institute of Scientific and Technical Information of China (English)

Li Xianjie; Song Xinwang; Yue Xiang'an; Hou Jirui; Fang Lichun; Zhang Huazhen

2007-01-01

Two sand packs were filled with fine glass beads and quartz sand respectively. The characteristics of crosslinked polymer flowing through the sand packs as well as the influence of shear fracture of porous media on the in-depth profile modification of the weak gel generated from the crosslinked polymer were investigated. The results indicated that under the dynamic condition crosslinking reaction happened in both sand packs,and the weak gels in these two cases became small gel particles after water flooding. The differences were:the dynamic gelation time in the quartz sand pack was longer than that in the glass bead pack. Residual resistance factor (FRR) caused by the weak gel in the quartz sand pack was smaller than that in the glass bead pack. The weak gel became gel particles after being scoured by subsequent flood water. A weak gel with uniform apparent viscosity and sealing characteristics was generated in every part of the glass bead pack,which could not only move deeply into the sand pack but also seal the high capacity channels again when it reached the deep part. The weak gel performed in-depth profile modification in the glass bead pack,while in the quartz sand pack,the weak gel was concentrated with 100 cm from the entrance of the sand pack. When propelled by the subsequent flood water,the weak gel could move towards the deep part of the sand pack but then became tiny gel particles and could not effectively seal the high capacity channels there. The in-depth profile modification of the weak gel was very weak in the quartz sand pack. It was the shear fracture of porous media that mainly affected the properties and weakened the in-depth profile modification of the weak gel.

Quantitative evaluation of sputtering induced surface roughness and its influence on AES depth profiles of polycrystalline Ni/Cu multilayer thin films

Energy Technology Data Exchange (ETDEWEB)

Yan, X.L.; Coetsee, E. [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Wang, J.Y., E-mail: wangjy@stu.edu.cn [Department of Physics, Shantou University, 243 Daxue Road, Shantou, 515063, Guangdong (China); Swart, H.C., E-mail: swartHC@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa); Terblans, J.J., E-mail: terblansjj@ufs.ac.za [Department of Physics, University of the Free State, P O Box 339, Bloemfontein, ZA9300 (South Africa)

2017-07-31

Highlights: • Linear Least Square (LLS) method used to separate Ni and Cu Auger spectra. • The depth-dependent ion sputtering induced roughness was quantitatively evaluated. • The depth resolution better when profiling with dual-ion beam vs. a single-ion beam. • AES depth profiling with a lower ion energy results in a better depth resolution. - Abstract: The polycrystalline Ni/Cu multilayer thin films consisting of 8 alternating layers of Ni and Cu were deposited on a SiO{sub 2} substrate by means of electron beam evaporation in a high vacuum. Concentration-depth profiles of the as-deposited multilayered Ni/Cu thin films were determined with Auger electron spectroscopy (AES) in combination with Ar{sup +} ion sputtering, under various bombardment conditions with the samples been stationary as well as rotating in some cases. The Mixing-Roughness-Information depth (MRI) model used for the fittings of the concentration-depth profiles accounts for the interface broadening of the experimental depth profiling. The interface broadening incorporates the effects of atomic mixing, surface roughness and information depth of the Auger electrons. The roughness values extracted from the MRI model fitting of the depth profiling data agrees well with those measured by atomic force microscopy (AFM). The ion sputtering induced surface roughness during the depth profiling was accordingly quantitatively evaluated from the fitted MRI parameters with sample rotation and stationary conditions. The depth resolutions of the AES depth profiles were derived directly from the values determined by the fitting parameters in the MRI model.

Depth Profiles in Maize ( Zea mays L.) Seeds Studied by Photoacoustic Spectroscopy

Science.gov (United States)

Hernández-Aguilar, C.; Domínguez-Pacheco, A.; Cruz-Orea, A.; Zepeda-Bautista, R.

2015-06-01

Photoacoustic spectroscopy (PAS) has been used to analyze agricultural seeds and can be applied to the study of seed depth profiles of these complex samples composed of different structures. The sample depth profile can be obtained through the photoacoustic (PA) signal, amplitude, and phase at different light modulation frequencies. The PA signal phase is more sensitive to changes of thermal properties in layered samples than the PA signal amplitude. Hence, the PA signal phase can also be used to characterize layers at different depths. Thus, the objective of the present study was to obtain the optical absorption spectra of maize seeds ( Zea mays L.) by means of PAS at different light modulation frequencies (17 Hz, 30 Hz, and 50 Hz) and comparing these spectra with the ones obtained from the phase-resolved method in order to separate the optical absorption spectra of seed pericarp and endosperm. The results suggest the possibility of using the phase-resolved method to obtain optical absorption spectra of different seed structures, at different depths, without damaging the seed. Thus, PAS could be a nondestructive method for characterization of agricultural seeds and thus improve quality control in the food industry.

Study of damaged depth profiles of ion-irradiated PEEK

Czech Academy of Sciences Publication Activity Database

Vacík, Jiří; Hnatowicz, Vladimír; Červená, Jarmila; Apel, P. Yu.; Posta, S.; Kobayashi, Y.

2007-01-01

Roč. 201, 19-20 (2007), s. 8370-8372 ISSN 0257-8972 R&D Projects: GA MPO(CZ) 1H-PK2/05; GA MŠk 1P04LA213 Institutional research plan: CEZ:AV0Z10480505 Keywords : Oxygen irradiation * Poly-aryl-ether-ether ketone * Thermal neutron depth profiling (TNDP) Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders Impact factor: 1.678, year: 2007

Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

International Nuclear Information System (INIS)

Miccio, Luis A.; Kummali, Mohammed M.; Alegria, Angel; Montemartini, Pablo E.; Oyanguren, Patricia A.; Schwartz, Gustavo A.; Colmenero, Juan

2011-01-01

By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.

A new look at the steel cord-rubber adhesive interphase by chemical depth profiling

International Nuclear Information System (INIS)

Hammer, G.E.

2001-01-01

The adhesive interphase formed between brass plated steel cord and sulfur crosslinked rubber is known to be a complex layer of metal oxides, sulfides, and rubber. Hostile aging of this system produces changes in the structure, morphology, thickness, and mechanical properties of this layer. In a previous publication it has been shown that the overall thickness of the sulfide layer as measured by depth profiling with Auger electron spectroscopy could be used to characterize the degradation of the adhesive bond [G. E. Hammer et al., J. Vac. Sci. Technol. A 12, 2388 (1994)]. In this work multivariate statistical analysis of the sulfur Auger electron spectra was used to produce chemical depth profiles of the individual copper and zinc sulfide layers. These chemical depth profiles give new insight into the adhesion degradation mechanism on the nanometer scale. Particularly, the percentage of copper sulfide in the layer was found to be an accurate predictor of adhesion degradation

Design and construction of an analytical instrument for neutron depth profiling

International Nuclear Information System (INIS)

Mutis, Octavio; Venegas, Rafael

1998-01-01

Full text: An experimental facility for Neutron Depth Profiling, recently constructed at CCHEN's laboratories is described. The technique allows to measure the mean atomic concentration ρ(x) of certain isotopes as a function of distance x to the surface for the first depth microns. The observation area is about 15 mm in diameter and the range in depth depends on the matrix stopping power and on the energy of the charged particle associated with the A(n,y)B reaction, in which this technique is supported, where A is the isotope to be detected, y is an α particle or a proton and B is the recoil nucleus. The spatial resolution depends upon the characteristics of the detection chain and its geometry and of the thermal spectrum of the beam. An appropriate deconvolution on the merging particle energy spectrum allows to recover the concentration profile. The application of the technique to the analysis of some phospho borosilicate films deposited on s Si substrate, lithium tantalate ceramics deposited on Si substrate and a sintered of lithium and Zn-Ni-Mn oxide are shown here with a resolution comparative to that of advanced laboratories

Nondestructive investigatons of the depth profile of PZT ferroelectric films

Czech Academy of Sciences Publication Activity Database

Deineka, Alexander; Glinchuk, M. D.; Jastrabík, Lubomír; Suchaneck, G.; Gerlach, G.

2001-01-01

Roč. 264, - (2001), s. 151-156 ISSN 0015-0193 R&D Projects: GA MŠk LN00A015; GA ČR GA202/00/1425 Institutional research plan: CEZ:AV0Z1010914 Keywords : ferroelectric film * depth profile * interface Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 0.471, year: 2001

Excess carrier depths profiles in Cu(In,Ga)(S,Se){sub 2} absorbers from spectral photoluminescence

Energy Technology Data Exchange (ETDEWEB)

Koenne, Nils; Knabe, Sebastian; Bauer, Gottfried H. [Institute of Physics, CvO University Oldenburg (Germany); Witte, Wolfram; Hariskos, Dimitrios [Zentrum fuer Sonnenenergie- und Wasserstoff-Forschung Baden-Wuerttemberg (ZSW), Stuttgart (Germany); Meeder, Alexander [SULFURCELL Solartechnik GmbH, Berlin (Germany)

2011-07-01

The polycrystalline structure of chalcopyrite absorbers, such as Cu(In,Ga)(S,Se){sub 2} and their complex metallurgical composition results in lateral and depth dependent inhomogeneities. The spectral photoluminescence (PL) recorded from front and rear side of these chalcopyrite thin-film systems shows a distinct different behavior in particular of the high energy PL-wing which is strongly governed by absorption/emission approaching unity, as well as by re-absorption of emitted PL-photons and their depth dependent origin, say excess carrier depth profile. We define a contrast parameter for the high energy PL-yield of the fluxes recorded from front side and rear side and we proof the origin of the experimental contrast with numerical simulations of spectral PL-yields via Planck's generalized law for different depth profiles of excess carriers and band gap/absorption coefficients. By comparison of experimental contrast parameters with results from numerical simulations we conclude a set of regimes of realistic combinations of depth profiles for excess carriers and band gaps.

Electrochemical depth profiling of multilayer metallic structures: An aluminum brazing sheet

International Nuclear Information System (INIS)

Afshar, F. Norouzi; Ambat, R.; Kwakernaak, C.; Wit, J.H.W. de; Mol, J.M.C.; Terryn, H.

2012-01-01

Highlights: ► Localized electrochemical cell and glow discharge optical emission spectrometry were used. ► An electrochemical depth profile of an aluminum brazing sheet was obtained. ► The electrochemical responses were correlated to the microstructural features. - Abstract: Combinatory localized electrochemical cell and glow discharge optical emission spectrometry (GDOES) measurements were performed to obtain a thorough in depth electrochemical characterization of an aluminum brazing sheet. By defining electrochemical criteria i.e. breakdown potential, corrosion potential, cathodic and anodic reactivities, and tracking their changes as a function of depth, the evolution of electrochemical responses through out the material thickness were analyzed and correlated to the corresponding microstructural features. Polarization curves in 1 wt% NaCl solution at pH 2.8 were obtained at different depths from the surface using controlled sputtering in a glow discharge optical emission spectrometer as a sample preparation technique. The anodic and cathodic reactivity of the top surface areas were significantly higher than that of the bulk, thus indicating these areas to be more susceptible to localized attack. Consistent with this, optical microscopy and scanning electron microscope analysis revealed a relatively high density of fine intermetallic and silicon particles at these areas. The corrosion mechanism of the top layers was identified to be intergranular and pitting corrosion, while lower sensitivity to these localized attacks were detected toward the brazing sheet core. The results highlight the successful application of the electrochemical depth profiling approach in prediction of the corrosion behavior of the aluminum brazing sheet and the importance of the electrochemical activity of the outer 10 μm in controlling the corrosion performance of the aluminum brazing sheet.

76 FR 37059 - Siuslaw National Forest; Oregon; Oregon Dunes NRA Management Area 10 (C) Route and Area Designation

Science.gov (United States)

2011-06-24

... DEPARTMENT OF AGRICULTURE Forest Service Siuslaw National Forest; Oregon; Oregon Dunes NRA Management Area 10 (C) Route and Area Designation AGENCY: Forest Service, USDA. ACTION: Notice of intent to... (C) today are not designated routes. This has in turn led to greater and unnecessary impacts to...

Comparison of L-curve and LOOCV depth profiles from TAARXPS data

Energy Technology Data Exchange (ETDEWEB)

Paynter, R.W., E-mail: royston_paynter@emt.inrs.ca

2017-01-15

Highlights: • Regularized profiles were extracted from TAARXPS data. • The L-curve and LOO cross-validation were used to choose the regularization parameter. • The two parameter choice methods were compared. - Abstract: Time and angle resolved X-ray photoelectron spectroscopy (TAARXPS) data, obtained from polystyrene samples exposed to an oxygen/helium plasma, have been interpreted using 1st order Tikhonov regularization to smooth the extracted depth profiles. Two methods for the choice of the regularization parameter, namely the L-curve method and leave-one-out cross-validation (LOOCV), are compared and contrasted.

Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen flooding

International Nuclear Information System (INIS)

Liu, R.; Wee, A.T.S.

2004-01-01

Following the increasingly stringent requirements in the characterization of sub-micron IC devices, an understanding of the various factors affecting ultra shallow depth profiling in secondary ion mass spectrometry (SIMS) has become crucial. Achieving high depth resolution (of the order of 1 nm) is critical in the semiconductor industry today, and various methods have been developed to optimize depth resolution. In this paper, we will discuss ultra shallow SIMS depth profiling using B and Ge delta-doped Si samples using low energy 0.5 keV O 2 + primary beams. The relationship between depth resolution of the delta layers and surface topography measured by atomic force microscopy (AFM) is studied. The effect of oxygen flooding and sample rotation, used to suppress surface roughening is also investigated. Oxygen flooding was found to effectively suppress roughening and gives the best depth resolution for B, but sample rotation gives the best resolution for Ge. Possible mechanisms for this are discussed

Quantitative depth profiling of K-doped fullerene films using XPS and SIMS

Czech Academy of Sciences Publication Activity Database

Oswald, S.; Janda, Pavel; Dunsch, L.

2003-01-01

Roč. 141, 1-2 (2003), s. 79-85 E-ISSN 1436-5073 Institutional research plan: CEZ:AV0Z4040901 Keywords : XPS * SIMS * depth profiling * fullerenes * doping Subject RIV: CG - Electrochemistry Impact factor: 0.784, year: 2003

Quantitative depth profiling of near surface semiconductor structures using ultra low energy SIMS analysis

International Nuclear Information System (INIS)

Elliner, D.I.

1999-09-01

The continual reduction in size of semiconductor structures and depths of junctions is putting a greater strain on characterization techniques. Accurate device and process modelling requires quantified electrical and dopant profiles from the topmost few nanometres. Secondary ion mass spectrometry (SIMS) is an analytical technique commonly used in the semiconductor industry to measure concentration depth profiles. To allow the quantification of the features that are closer to the surface, lower energy ions are employed, which also improves the available depth resolution. The development of the floating ion gun (FLIG) has made it possible to use sub keV beam energies on a routine basis, allowing quantified dopant profiles to be obtained within the first few nanometres of the surface. This thesis demonstrates that, when profiling with oxygen ion beams, greatest certainty in the retained dose is achieved at normal incidence, and when analysing boron accurate profile shapes are only obtained when the primary beam energy is less than half that of the implant. It was shown that it is now possible to profile, though with slower erosion rates and a limited dynamic range, with 100 eV oxygen (0 2 + ) ion beams. Profile features that had developed during rapid thermal annealing, that could only be observed when ultra low energy ion beams were used, were investigated using various analytical techniques. Explanations of the apparently inactive dopant were proposed, and included suggestions for cluster molecules. The oxide thickness of fully formed altered layers has also been investigated. The results indicate that a fundamental change in the mechanism of oxide formation occurs, and interfaces that are sharper than those grown by thermal oxidation can be produced using sub-keV ion beams. (author)

RBS/NRA/channeling analysis of implanted immiscible species

International Nuclear Information System (INIS)

Naramoto, H.; Yamamoto, S.; Narumi, K.

2000-01-01

Ion implantation of immiscible elements was performed to prepare supersaturated substance for further heat treatment. 63 Cu ion implantation was made at low temperature into Nb(1 0 0), (1 1 0) and (1 1 1) single crystal films on sapphire, and the induced lattice damage and the lattice location of implanted Cu atoms were analyzed by 2.7 MeV 4 He + RBS/channeling. The coherent segregation of 63 Cu atoms with specific crystallographic orientations was found in the near surface region (Cu(1 0 0)/Nb(1 0 0), Cu(1 1 1)/Nb(1 1 0) and Cu(1 1 0)/Nb(1 1 1)). The same kind of study was also made in Ir(1 0 0)/MgO(1 0 0) implanted with 50 keV 12 C + ions. In addition to 2 MeV 4 He + RBS/channeling, 1.22 MeV d + RBS/NRA/channeling was employed to detect implanted 12 C atoms. The results suggest that 12 C atoms are aligned along Ir direction at least by low temperature implantation followed by thermal annealing

Depth profiling of boron implanted silicon by positron beam

International Nuclear Information System (INIS)

Oevuenc, S.

2004-01-01

Positron depth profiling analyses of low energy implants of silicon aim to observe tbe structure and density of the vacancies generating by implantation and the effect of annealing. This work present the results to several set of data starting S and W parameters. Boron implanted Silicon samples with different implantation energies,20,22,24,and 26 keV are analyzed by Slow positron beam (0-40 keV and 10 5 e + /s )(Variable Energy Positron) at the Positron Centre Delf-HOLLAND

Breadth and Depth of Vocabulary Knowledge and Their Effects on L2 Vocabulary Profiles

Science.gov (United States)

Bardakçi, Mehmet

2016-01-01

Breadth and depth of vocabulary knowledge have been studied from many different perspectives, but the related literature lacks serious studies dealing with their effects on vocabulary profiles of EFL learners. In this paper, with an aim to fill this gap, the relative effects of breadth and depth of vocabulary knowledge on L2 vocabulary profiles…

Depth profiles of H and O in thin films of a-Si:H

International Nuclear Information System (INIS)

Sie, S.H.; Ryan, C.J.

1985-01-01

Detailed depth profiles of hydrogen and oxygen were measured, in thin film samples of a-Si:H produced under varying conditions, using the reaction 1 H( 19 F,α γ) 16 O in the vicinity of the resonance at E( 19 F) = 6.417 MeV to profile hydrogen, and resonant elastic α scattering near the resonance at Eα = 3.0359 MeV to profile oxygen. Contrasting results reflecting the different fabrication conditions were obtained and these were correlated with the measured electrical properties

Opto-thermal moisture content and moisture depth profile measurements in organic materials

NARCIS (Netherlands)

Xiao, P.; Guo, X.; Cui, Y.Y.; Imhof, R.; Bicanic, D.D.

2004-01-01

Opto-thermal transient emission radiometry(OTTER) is a infrared remote sensing technique, which has been successfully used in in vivo skin moisture content and skin moisture depth profiling measurements.In present paper, we extend this moisture content measurement capability to analyze the moisture

Chemometric characterization of soil depth profiles

International Nuclear Information System (INIS)

Krieg, M.; Einax, J.

1994-01-01

The application of multivariate-statistical methods to the description of the metal distribution in soil depth profiles is shown. By means of cluster analysis, it is possible to get a first overview of the main differences in the metal status of the soil horizons. In case of anthropogenic soil pollution or geogenic enrichment, cluster analysis was able to detect the extent of the polluted soil layer or the different geological layers. The results of cluster analysis can be confirmed by means of multidimensional variance and discriminant analysis. Methods of discriminant analysis can also be used as a tool to determine the optimum number of variables which has to be measured for the classification of unknown soil samples into different pollution levels. Factor analysis yields an identification of not directly observable relationships between the variables. With additional knowledge about the orographic situation of the area and the probable sources of emission the factor loadings give information on the immission structure at the sampling location. (orig.)

Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy

International Nuclear Information System (INIS)

Wang Chuangye; Morgner, Harald

2011-01-01

In the current work, we first reconstructed the molar fraction-depth profiles of cation and anion near the surface of tetrabutylammonium iodide dissolved in formamide by a refined calculation procedure, based on angle resolved X-ray photoelectron spectroscopy experiments. In this calculation procedure, both the transmission functions of the core levels and the inelastic mean free paths of the photoelectrons have been taken into account. We have evaluated the partial molar volumes of surfactant and solvent by the densities of such solutions with different bulk concentrations. With those partial molar volumes, the molar concentration-depth profiles of tetrabutylammonium ion and iodide ion were determined. The surface excesses of both surfactant ions were then achieved directly by integrating these depth profiles. The anionic molar concentration-depth profiles and surface excesses have been compared with their counterparts determined by neutral impact ion scattering spectroscopy. The comparisons exhibit good agreements. Being capable of determining molar concentration-depth profiles of surfactant ions by core levels with different kinetic energies may extend the applicable range of ARXPS in investigating solution surfaces.

A comparison of mixing depths observed by ground-based wind profilers and an airborne lidar

Energy Technology Data Exchange (ETDEWEB)

White, A.B.; Senff, C. [Univ. of Colorado/NOAA Environmental Technology Lab., Cooperative Inst. for Research in Environmental Sciences, Boulder, CO (United States); Banta, R.M. [NOAA Environmental Technology Lab., Boulder, CO (United States)

1997-10-01

The mixing depth is one of the most important parameters in air pollution studies because it determines the vertical extent of the `box` in which pollutants are mixed and dispersed. During the 1995 Southern Oxidants Study (SOS95), scientists from the National Oceanic and Atmospheric Administration Environmental Technology Laboratory (NOAA/ETL) deployed four 915-MHz boundary-layer radar/wind profilers (hereafter radars) in and around the Nashville, Tennessee metropolitan area. Scientists from NOAA/ETL also operated an ultraviolet differential absorption lidar (DIAL) onboard a CASA-212 aircraft. Profiles from radar and DIAL can be used to derive estimates of the mixing depth. The methods used for both instruments are similar in that they depend on information derived from the backscattered power. However, different scattering mechanisms for the radar and DIAL mean that different tracers of mixing depth are measured. In this paper we compare the mixing depth estimates obtained from the radar and DIAL and discuss the similarities and differences that occur. (au)

Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool

International Nuclear Information System (INIS)

Jeynes, C; Barradas, N P; Marriott, P K; Boudreault, G; Jenkin, M; Wendler, E; Webb, R P

2003-01-01

Rutherford backscattering spectrometry (RBS) and related techniques have long been used to determine the elemental depth profiles in films a few nanometres to a few microns thick. However, although obtaining spectra is very easy, solving the inverse problem of extracting the depth profiles from the spectra is not possible analytically except for special cases. It is because these special cases include important classes of samples, and because skilled analysts are adept at extracting useful qualitative information from the data, that ion beam analysis is still an important technique. We have recently solved this inverse problem using the simulated annealing algorithm. We have implemented the solution in the 'IBA DataFurnace' code, which has been developed into a very versatile and general new software tool that analysts can now use to rapidly extract quantitative accurate depth profiles from real samples on an industrial scale. We review the features, applicability and validation of this new code together with other approaches to handling IBA (ion beam analysis) data, with particular attention being given to determining both the absolute accuracy of the depth profiles and statistically accurate error estimates. We include examples of analyses using RBS, non-Rutherford elastic scattering, elastic recoil detection and non-resonant nuclear reactions. High depth resolution and the use of multiple techniques simultaneously are both discussed. There is usually systematic ambiguity in IBA data and Butler's example of ambiguity (1990 Nucl. Instrum. Methods B 45 160-5) is reanalysed. Analyses are shown: of evaporated, sputtered, oxidized, ion implanted, ion beam mixed and annealed materials; of semiconductors, optical and magnetic multilayers, superconductors, tribological films and metals; and of oxides on Si, mixed metal silicides, boron nitride, GaN, SiC, mixed metal oxides, YBCO and polymers. (topical review)

Depth profiling of oxide-trapped charges in 6H-SiC MOS structures by slant etching method

Energy Technology Data Exchange (ETDEWEB)

Saitoh, Kazunari; Takahashi, Yoshihiro; Ohnishi, Kazunori [Nihon Univ., Tokyo (Japan). Coll. of Science and Technology; Yoshikawa, Masahito; Ohshima, Takeshi; Itoh, Hisayoshi; Nashiyama, Isamu

1997-03-01

In this paper, we propose a method to evaluate the depth profile of trapped charges in an oxide layer on SiC. Using this method, 6H-SiC MOS structures with different oxide thickness were fabricated on the same substrate under the same oxidation condition, and the depth profile of oxide-trapped charges before and after {sup 60}Co-gamma ray irradiation were obtained. It is found, from the depth profiling, that the trapping mechanism of electrons and holes in the oxide strongly depends on the bias polarity during irradiation, and these charges are trapped near 6H-SiC/SiO{sub 2} interface. We believe that this method is very useful for estimation of the oxide-trapped charges in 6H-SiC MOS structures. (author)

The impact of molecular emission in compositional depth profiling using Glow Discharge-Optical Emission Spectroscopy

International Nuclear Information System (INIS)

Bengtson, Arne

2008-01-01

The scope of this paper is to investigate and discuss how molecular emission can affect elemental analysis in glow discharge optical emission (GD-OES), particularly in compositional depth profiling (CDP) applications. Older work on molecular emission in glow discharges is briefly reviewed, and the nature of molecular emission spectra described. Work on the influence of hydrogen in the plasma, in particular elevated background due to a continuum spectrum, is discussed. More recent work from sputtering of polymers and other materials with a large content of light elements in a Grimm type source is reviewed, where substantial emission has been observed from several light diatomic molecules (CO, CH, OH, NH, C 2 ). It is discussed how the elevated backgrounds from such molecular emission can lead to significant analytical errors in the form of 'false' depth profile signals of several atomic analytical lines. Results from a recent investigation of molecular emission spectra from mixed gases in a Grimm type glow discharge are presented. An important observation is that dissociation and subsequent recombination processes occur, leading to formation of molecular species not present in the original plasma gas. Experimental work on depth profiling of a polymer coating and a thin silicate film, using a spectrometer equipped with channels for molecular emission lines, is presented. The results confirm that molecular emission gives rise to apparent depth profiles of elements not present in the sample. The possibilities to make adequate corrections for such molecular emission in CDP of organic coatings and very thin films are discussed

The impact of molecular emission in compositional depth profiling using Glow Discharge-Optical Emission Spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Bengtson, Arne [Corrosion and Metals Research Institute, Dr. Kristinas vaeg 48, Stockholm (Sweden)], E-mail: arne.bengtson@kimab.com

2008-09-15

The scope of this paper is to investigate and discuss how molecular emission can affect elemental analysis in glow discharge optical emission (GD-OES), particularly in compositional depth profiling (CDP) applications. Older work on molecular emission in glow discharges is briefly reviewed, and the nature of molecular emission spectra described. Work on the influence of hydrogen in the plasma, in particular elevated background due to a continuum spectrum, is discussed. More recent work from sputtering of polymers and other materials with a large content of light elements in a Grimm type source is reviewed, where substantial emission has been observed from several light diatomic molecules (CO, CH, OH, NH, C{sub 2}). It is discussed how the elevated backgrounds from such molecular emission can lead to significant analytical errors in the form of 'false' depth profile signals of several atomic analytical lines. Results from a recent investigation of molecular emission spectra from mixed gases in a Grimm type glow discharge are presented. An important observation is that dissociation and subsequent recombination processes occur, leading to formation of molecular species not present in the original plasma gas. Experimental work on depth profiling of a polymer coating and a thin silicate film, using a spectrometer equipped with channels for molecular emission lines, is presented. The results confirm that molecular emission gives rise to apparent depth profiles of elements not present in the sample. The possibilities to make adequate corrections for such molecular emission in CDP of organic coatings and very thin films are discussed.

Photothermal depth profiling: Comparison between genetic algorithms and thermal wave backscattering (abstract)

Science.gov (United States)

Li Voti, R.; Sibilia, C.; Bertolotti, M.

2003-01-01

Photothermal depth profiling has been the subject of many papers in the last years. Inverse problems on different kinds of materials have been identified, classified, and solved. A first classification has been done according to the type of depth profile: the physical quantity to be reconstructed is the optical absorption in the problems of type I, the thermal effusivity for type II, and both of them for type III. Another classification may be done depending on the time scale of the pump beam heating (frequency scan, time scan), or on its geometrical symmetry (one- or three-dimensional). In this work we want to discuss two different approaches, the genetic algorithms (GA) [R. Li Voti, C. Melchiorri, C. Sibilia, and M. Bertolotti, Anal. Sci. 17, 410 (2001); R. Li Voti, Proceedings, IV Int. Workshop on Advances in Signal Processing for Non-Destructive Evaluation of Materials, Quebec, August 2001] and the thermal wave backscattering (TWBS) [R. Li Voti, G. L. Liakhou, S. Paoloni, C. Sibilia, and M. Bertolotti, Anal. Sci. 17, 414 (2001); J. C. Krapez and R. Li Voti, Anal. Sci. 17, 417 (2001)], showing their performances and limits of validity for several kinds of photothermal depth profiling problems: The two approaches are based on different mechanisms and exhibit obviously different features. GA may be implemented on the exact heat diffusion equation as follows: one chromosome is associated to each profile. The genetic evolution of the chromosome allows one to find better and better profiles, eventually converging towards the solution of the inverse problem. The main advantage is that GA may be applied to any arbitrary profile, but several disadvantages exist; for example, the complexity of the algorithm, the slow convergence, and consequently the computer time consumed. On the contrary, TWBS uses a simplified theoretical model of heat diffusion in inhomogeneous materials. According to such a model, the photothermal signal depends linearly on the thermal effusivity

Compositional depth profiles of the type 316 stainless steel undergone the corrosion in liquid lithium using laser-induced breakdown spectroscopy

Science.gov (United States)

Li, Ying; Ke, Chuan; Liu, Xiang; Gou, Fujun; Duan, Xuru; Zhao, Yong

2017-12-01

Liquid metal lithium cause severe corrosion on the surface of metal structure material that used in the blanket and first wall of fusion device. Fast and accurate compositional depth profile measurement for the boundary layer of the corroded specimen will reveal the clues for the understanding and evaluation of the liquid lithium corrosion process as well as the involved corrosion mechanism. In this work, the feasibility of laser-induced breakdown spectroscopy for the compositional depth profile analysis of type 316 stainless steel which was corroded by liquid lithium in certain conditions was demonstrated. High sensitivity of LIBS was revealed especially for the corrosion medium Li in addition to the matrix elements of Fe, Cr, Ni and Mn by the spectral analysis of the plasma emission. Compositional depth profile analysis for the concerned elements which related to corrosion was carried out on the surface of the corroded specimen. Based on the verified local thermodynamic equilibrium shot-by-shot along the depth profile, the matrix effect was evaluated as negligible by the extracted physical parameter of the plasmas generated by each laser pulse in the longitudinal depth profile. In addition, the emission line intensity ratios were introduced to further reduce the impact on the emission line intensity variations arise from the strong inhomogeneities on the corroded surface. Compositional depth profiles for the matrix elements of Fe, Cr, Ni, Mn and the corrosion medium Li were constructed with their measured relative emission line intensities. The distribution and correlations of the concerned elements in depth profile may indicate the clues to the complicated process of composition diffusion and mass transfer. The results obtained demonstrate the potentiality of LIBS as an effective technique to perform spectrochemical measurement in the research fields of liquid metal lithium corrosion.

Thermal Depth Profiling Reconstruction by Multilayer Thermal Quadrupole Modeling and Particle Swarm Optimization

International Nuclear Information System (INIS)

Zhao-Jiang, Chen; Shu-Yi, Zhang

2010-01-01

A new hybrid inversion method for depth profiling reconstruction of thermal conductivities of inhomogeneous solids is proposed based on multilayer quadrupole formalism of thermal waves, particle swarm optimization and sequential quadratic programming. The reconstruction simulations for several thermal conductivity profiles are performed to evaluate the applicability of the method. The numerical simulations demonstrate that the precision and insensitivity to noise of the inversion method are very satisfactory. (condensed matter: structure, mechanical and thermal properties)

Micro-Raman depth profile investigations of beveled Al+-ion implanted 6H-SiC samples

International Nuclear Information System (INIS)

Zuk, J.; Romanek, J.; Skorupa, W.

2009-01-01

6H-SiC single crystals were implanted with 450 keV Al + -ions to a fluence of 3.4 x 10 15 cm -2 , and in a separate experiment subjected to multiple Al + implantations with the four energies: 450, 240, 115 and 50 keV and different fluences to obtain rectangular-like depth distributions of Al in SiC. The implantations were performed along [0 0 0 1] channeling and non-channeling ('random') directions. Subsequently, the samples were annealed for 10 min at 1650 deg. C in an argon atmosphere. The depth profiles of the implanted Al atoms were obtained by secondary ion mass spectrometry (SIMS). Following implantation and annealing, the samples were beveled by mechanical polishing. Confocal micro-Raman spectroscopic investigations were performed with a 532 nm wavelength laser beam of a 1 μm focus diameter. The technique was used to determine precisely the depth profiles of TO and LO phonon lines intensity in the beveled samples to a depth of about 2000 nm. Micro-Raman spectroscopy was also found to be useful in monitoring very low levels of disorder remaining in the Al + implanted and annealed 6H-SiC samples. The micro-Raman technique combined with sample beveling also made it possible the determination of optical absorption coefficient profiles in implanted subsurface layers.

Measurements of europium-152 depth profile of stone embankments exposed the Nagasaki atomic bomb for neutron spectrum analysis

International Nuclear Information System (INIS)

Tatsumi-Miyajima, Junko; Shimasaki, Tatsuya; Okajima, Shunzo; Takada, Jitsuya; Yoshida, Masahiro; Takao, Hideaki; Okumura, Yutaka; Nakazawa, Masaharu.

1990-01-01

Quantitative measurement of neutron-induced radionuclide of 152 Eu in rocks near the hypocenter (ground center of the atomic bomb explosion) in Nagasaki was performed to obtain the depth profiles and calculate the neutron energy spectrum. Core samples were drilled and taken from the stone embankments on both sides of river within a radius of 500 m from the hypocenter. After cutting each core into about 27 mm-thick sections, each section was measured its gamma-ray spectrum with a pure germanium semiconductor detector and analyzed a content of natural europium by the activation method. The highest value 8.0 x 10 -2 Bq/μg of 152 Eu at the time of the blast was obtained from the surface plates of rock cores collected near the hypocenter. The surface activity of cores was reduced with increasing the slant distances from the hypocenter. The slopes of the depth profiles were similar among samples taken from the same location. In order to analyze the depth profile of 152 Eu activity in rock andesite, experiments using a fast neutron reactor and thermal neutron reactor were carried out. Comparing the measurements on the A-bomb exposure rock with the simulated results at the reactors, among the experiments, the depth profile using the neutron moderator of 10 mm polyethylene was closed to that obtained from the A-bomb exposed samples. The experiment of thermal neutron incidence only could not reproduce the profiles from the A-bomb exposed samples. This fact indicates that the depth profiles of 152 Eu in rock exposed to the A-bomb include valuable information concerning the neutron spectrum and intensity. (author)

Quantitative considerations in medium energy ion scattering depth profiling analysis of nanolayers

Energy Technology Data Exchange (ETDEWEB)

Zalm, P.C.; Bailey, P. [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom); Reading, M.A. [Physics and Materials Research Centre, University of Salford, Salford M5 4WT (United Kingdom); Rossall, A.K. [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom); Berg, J.A. van den, E-mail: j.vandenberg@hud.ac.uk [International Institute for Accelerator Applications, University of Huddersfield, Queensgate, Huddersfield HD1 3DH (United Kingdom)

2016-11-15

The high depth resolution capability of medium energy ion scattering (MEIS) is becoming increasingly relevant to the characterisation of nanolayers in e.g. microelectronics. In this paper we examine the attainable quantitative accuracy of MEIS depth profiling. Transparent but reliable analytical calculations are used to illustrate what can ultimately be achieved for dilute impurities in a silicon matrix and the significant element-dependence of the depth scale, for instance, is illustrated this way. Furthermore, the signal intensity-to-concentration conversion and its dependence on the depth of scattering is addressed. Notably, deviations from the Rutherford scattering cross section due to screening effects resulting in a non-coulombic interaction potential and the reduction of the yield owing to neutralization of the exiting, backscattered H{sup +} and He{sup +} projectiles are evaluated. The former mainly affects the scattering off heavy target atoms while the latter is most severe for scattering off light target atoms and can be less accurately predicted. However, a pragmatic approach employing an extensive data set of measured ion fractions for both H{sup +} and He{sup +} ions scattered off a range of surfaces, allows its parameterization. This has enabled the combination of both effects, which provides essential information regarding the yield dependence both on the projectile energy and the mass of the scattering atom. Although, absolute quantification, especially when using He{sup +}, may not always be achievable, relative quantification in which the sum of all species in a layer adds up to 100%, is generally possible. This conclusion is supported by the provision of some examples of MEIS derived depth profiles of nanolayers. Finally, the relative benefits of either using H{sup +} or He{sup +} ions are briefly considered.

Design and construction of the facility for neutron depth profiling in research reactor RECH-1

International Nuclear Information System (INIS)

Mutis P, Octavio; Navarro A, Gustavo; Henriquez A, Carlos; Pereda B, Claudio

2002-01-01

Here is described the experimental facility for Neutron Depth Profiling, NDP, constructed at the CCHEN laboratories, as well as some general aspects of the technique. It is also shown applications to the concentration analysis of 10 B and 6 Li as a function of depth for borophosphosilicate glass, BPSG, and for a thick sinter of 6 Li in a zinc-nickel-manganese oxide. Achieved depth resolution is comparable to that obtained in reference advanced laboratories. (author)

Molecular depth profiling of multi-layer systems with cluster ion sources

Energy Technology Data Exchange (ETDEWEB)

Cheng, Juan [Department of Chemistry, Penn State University, University Park, PA 16802 (United States); Winograd, Nicholas [Department of Chemistry, Penn State University, University Park, PA 16802 (United States)]. E-mail: nxw@psu.edu

2006-07-30

Cluster bombardment of molecular films has created new opportunities for SIMS research. To more quantitatively examine the interaction of cluster beams with organic materials, we have developed a reproducible platform consisting of a well-defined sugar film (trehalose) doped with peptides. Molecular depth profiles have been acquired with these systems using C{sub 60} {sup +} bombardment. In this study, we utilize this platform to determine the feasibility of examining buried interfaces for multi-layer systems. Using C{sub 60} {sup +} at 20 keV, several systems have been tested including Al/trehalose/Si, Al/trehalose/Al/Si, Ag/trehalose/Si and ice/trehalose/Si. The results show that there can be interactions between the layers during the bombardment process that prevent a simple interpretation of the depth profile. We find so far that the best results are obtained when the mass of the overlayer atoms is less than or nearly equal to the mass of the atoms in buried molecules. In general, these observations suggest that C{sub 60} {sup +} bombardment can be successfully applied to interface characterization of multi-layer systems if the systems are carefully chosen.

Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered Neutrals

Science.gov (United States)

Willingham, D.; Brenes, D. A.; Winograd, N.; Wucher, A.

2010-01-01

Molecular depth profiles of model organic thin films were performed using a 40 keV C60+ cluster ion source in concert with TOF-SIMS. Strong-field photoionization of intact neutral molecules sputtered by 40 keV C60+ primary ions was used to analyze changes in the chemical environment of the guanine thin films as a function of ion fluence. Direct comparison of the secondary ion and neutral components of the molecular depth profiles yields valuable information about chemical damage accumulation as well as changes in the molecular ionization probability. An analytical protocol based on the erosion dynamics model is developed and evaluated using guanine and trehalose molecular secondary ion signals with and without comparable laser photoionization data. PMID:26269660

Dual beam organic depth profiling using large argon cluster ion beams

Science.gov (United States)

Holzweber, M; Shard, AG; Jungnickel, H; Luch, A; Unger, WES

2014-01-01

Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq3), materials commonly used in organic light-emitting diodes industry, was carried out using time-of-flight SIMS in dual beam mode. The sample used in this study consists of a ∽400-nm-thick NPB matrix with 3-nm marker layers of Alq3 at depth of ∽50, 100, 200 and 300 nm. Argon cluster sputtering provides a constant sputter yield throughout the depth profiles, and the sputter yield volumes and depth resolution are presented for Ar-cluster sizes of 630, 820, 1000, 1250 and 1660 atoms at a kinetic energy of 2.5 keV. The effect of cluster size in this material and over this range is shown to be negligible. © 2014 The Authors. Surface and Interface Analysis published by John Wiley & Sons Ltd. PMID:25892830

Micro-NRA and micro-3HIXE with He-3 microbeam on samples exposed in ASDEX Upgrade and Pilot-PSI machines

NARCIS (Netherlands)

Kelemen, M.; Zaloznik, A.; Vavpetic, P.; Pecovnik, M.; Pelicon, P.; Hakola, A.; Lahtinen, A.; Karhunen, J.; Piip, K.; van der Meiden, H. J.; Paris, P.; Laan, M.; Krieger, K.; Oberkofler, M.; Markelj, S.; ASDEX Upgrade team,

2017-01-01

Micro nuclear reaction analysis (micro-NRA) exploiting the nuclear reaction D(He-3,p)He-4 was used for post-mortem analyses of special marker samples, exposed to deuterium plasma inside ASDEX Upgrade (AUG) tokamak and to the deuterium plasma jet in the Pilot-PSI linear plasma gun. Lateral

Investigation of the depth profile of ion beam induced nanopatterns on Si with simultaneous metal incorporation

Energy Technology Data Exchange (ETDEWEB)

Khanbabaee, Behnam; Arezki, Bahia; Biermanns, Andreas; Pietsch, Ullrich [Festkoerperphysik, Universitaet Siegen, Siegen (Germany); Cornejo, Marina; Frost, Frank [Leibniz-Institut fuer Oberflaechenmodifizierung (IOM), Leipzig (Germany)

2011-07-01

Ion beam sputtering of semiconductor surfaces can modify the surface and produce a diversity of surface topographies such as periodic ripples or dot structures depended on sputtering parameters. Well ordered nanostructured surfaces have widely technological applications. Recent experiments have shown that the incorporation of metallic impurity atoms during the sputtering process plays a crucial role in pattern formation on the surfaces. These findings offer a new degree of freedom to control pattern formation. In this contribution we report on surface patterning due to Kr ion beam erosion on silicon surfaces with simultaneous Fe and Cr incorporation. We used X-ray reflectivity (XRR) to determine the depth profiles of metal ions as function of ion beam divergence angles and the mean incidence angle of the ions with respect to the surface normal. Depth profiles are correlated with degree of pattern formation determined by AFM. We show that the mean penetration depth and concentration of metal ions depends on the divergence angle of Kr beam provided by Kaufman source which supports the assumption that metal ions are created due to parasitic interaction of the Kr beam with the steel plate lining. The evaluated depth profile by XRR is in good agreement with SIMS and RBS results.

Deconvolution of charged particle spectra from neutron depth profiling using Simplex method

Czech Academy of Sciences Publication Activity Database

Hnatowicz, Vladimír; Vacík, Jiří; Fink, Dietmar

2010-01-01

Roč. 81, č. 7 (2010), 073906/1-073906/7 ISSN 0034-6748 R&D Projects: GA MŠk(CZ) LC06041 Institutional research plan: CEZ:AV0Z10480505 Keywords : neutron depth profiling * Simplex method * NDP Subject RIV: BG - Nuclear , Atomic and Molecular Physics, Colliders Impact factor: 1.598, year: 2010

Hemispheric aerosol vertical profiles: anthropogenic impacts on optical depth and cloud nuclei.

Science.gov (United States)

Clarke, Antony; Kapustin, Vladimir

2010-09-17

Understanding the effect of anthropogenic combustion upon aerosol optical depth (AOD), clouds, and their radiative forcing requires regionally representative aerosol profiles. In this work, we examine more than 1000 vertical profiles from 11 major airborne campaigns in the Pacific hemisphere and confirm that regional enhancements in aerosol light scattering, mass, and number are associated with carbon monoxide from combustion and can exceed values in unperturbed regions by more than one order of magnitude. Related regional increases in a proxy for cloud condensation nuclei (CCN) and AOD imply that direct and indirect aerosol radiative effects are coupled issues linked globally to aged combustion. These profiles constrain the influence of combustion on regional AOD and CCN suitable for challenging climate model performance and informing satellite retrievals.

Experimental analysis of bruises in human volunteers using radiometric depth profiling and diffuse reflectance spectroscopy

Science.gov (United States)

Vidovič, Luka; Milanič, Matija; Majaron, Boris

2015-07-01

We combine pulsed photothermal radiometry (PPTR) depth profiling with diffuse reflectance spectroscopy (DRS) measurements for a comprehensive analysis of bruise evolution in vivo. While PPTR enables extraction of detailed depth distribution and concentration profiles of selected absorbers (e.g. melanin, hemoglobin), DRS provides information in a wide range of visible wavelengths and thus offers an additional insight into dynamics of the hemoglobin degradation products. Combining the two approaches enables us to quantitatively characterize bruise evolution dynamics. Our results indicate temporal variations of the bruise evolution parameters in the course of bruise self-healing process. The obtained parameter values and trends represent a basis for a future development of an objective technique for bruise age determination.

Depth profile analysis of electrodeposited nanoscale multilayers by Secondary Neutral Mass Spectrometry (SNMS)

International Nuclear Information System (INIS)

Katona, G.L.; Berenyi, Z.; Vad, K.; Peter, L.

2006-01-01

Complete text of publication follows. Nanoscale multilayers have been in the focus of research since the discovery of the giant magnetoresistance (GMR) effect in this family of nanostructures. The first observation of GMR on sputtered magnetic/non-magnetic multilayers was followed by the detection of the same effect in electrodeposited Co-Ni-Cu/Cu multilayers within half a decade. Electrodeposition has long been considered as an inexpensive alternative of the high-vacuum methods to produce multilayers with GMR, although the GMR effect observed for electrodeposited multilayers is usually inferior to multilayers produced by physical methods. Electrochemistry appears to be an exclusive technology to produce multilayered nanowires by using porous templates. In spite of the large number of papers about the multilayers themselves, data on the depth profile of electrodeposited multilayer samples are very scarce. It has long been known that the simultaneous electrodeposition of the iron group metals takes place in the so-called anomalous manner. The diagnostic criterion of the anomalous codeposition is that the metallic component of lower standard potential (the Co in the case of Ni/Co) can be discharged together with the more noble one (Ni) at potentials where the less noble component (Co) alone cannot be deposited onto a substrate composed of the parent metal; moreover, the less noble metal (Co) is deposited preferentially. We have investigated the composition gradient along the growth direction of electrodeposited Co/Cu and CoNiCu/Cu multilayers films using SNMS. Samples were electrodeposited using the single bath method. Commercial Cu sheets and an Cr/Cu layer evaporated onto Si (111) surface were used as substrates with high and low roughness, respectively. The depth profiles of the samples were recorded using SNMS (INA-X, Specs GmbH, Berlin) in the Direct Bombardment Mode. Depth profile analysis of electrodeposited magnetic/nonmagnetic layered structures on

SIMS analyses of ultra-low-energy B ion implants in Si: Evaluation of profile shape and dose accuracy

International Nuclear Information System (INIS)

Magee, C.W.; Hockett, R.S.; Bueyueklimanli, T.H.; Abdelrehim, I.; Marino, J.W.

2007-01-01

Numerous experimental studies for near-surface analyses of B in Si have shown that the B distribution within the top few nanometers is distorted by secondary ion mass spectrometry (SIMS) depth profiling with O 2 -flooding or normal incidence O 2 bombardment. Furthermore, the presence of surface oxide affects the X j determination as well as B profile shape when SIMS analyses are conducted while fully oxidizing the analytical area. Nuclear techniques such as elastic recoil detection (ERD), nuclear reaction analysis (NRA), and high-resolution Rutherford backscattering spectrometry (HR-RBS), are known to provide a profile shape near the surface that is free of artifacts. Comparisons with SIMS analyses have shown that SIMS analyses without fully oxidizing the analytical area agree well with these techniques at sufficiently high concentrations (where the nuclear techniques are applicable). The ability to measure both the B profile and an oxide marker with this non-oxidizing SIMS technique also allows accurate positioning of the B profile with respect to the SiO 2 /Si interface. This SIMS analysis protocol has been used to study the differences in near-surface dopant distribution for plasma-based implants. This study specifically focuses on measuring near-surface profile shapes as well as total implant doses for ultra-shallow B implants in Si especially those made with high peak B concentrations

He, U, and Th Depth Profiling of Apatite and Zircon Using Laser Ablation Noble Gas Mass Spectrometry and SIMS

Science.gov (United States)

Monteleone, B. D.; van Soest, M. C.; Hodges, K. V.; Hervig, R.; Boyce, J. W.

2008-12-01

Conventional (U-Th)/He thermochronology utilizes single or multiple grain analyses of U- and Th-bearing minerals such as apatite and zircon and does not allow for assessment of spatial variation in concentration of He, U, or Th within individual crystals. As such, age calculation and interpretation require assumptions regarding 4He loss through alpha ejection, diffusive redistribution of 4He, and U and Th distribution as an initial condition for these processes. Although models have been developed to predict 4He diffusion parameters, correct for the effect of alpha ejection on calculated cooling ages, and account for the effect of U and Th zonation within apatite and zircon, measurements of 4He, U, and Th distribution have not been combined within a single crystal. We apply ArF excimer laser ablation, combined with noble gas mass spectrometry, to obtain depth profiles within apatite and zircon crystals in order to assess variations in 4He concentration with depth. Our initial results from pre-cut, pre-heated slabs of Durango apatite, each subjected to different T-t schedules, suggest a general agreement of 4He profiles with those predicted by theoretical diffusion models (Farley, 2000). Depth profiles through unpolished grains give reproducible alpha ejection profiles in Durango apatite that deviate from alpha ejection profiles predicted for ideal, homogenous crystals. SIMS depth profiling utilizes an O2 primary beam capable of sputtering tens of microns and measuring sub-micron resolution variation in [U], [Th], and [Sm]. Preliminary results suggest that sufficient [U] and [Th] zonation is present in Durango apatite to influence the form of the 4He alpha ejection profile. Future work will assess the influence of measured [U] and [Th] zonation on previously measured 4He depth profiles. Farley, K.A., 2000. Helium diffusion from apatite; general behavior as illustrated by Durango fluorapatite. J. Geophys. Res., B Solid Earth Planets 105 (2), 2903-2914.

ERYA (bulk)-finally available and ERYA profile-final adjustments

International Nuclear Information System (INIS)

Pedro de Jesus, A.

2014-01-01

Full text: It was announced and shown that the ERYA-bulk code for analysis of in-depth homogeneous samples is now available and may be downloaded from a web site, where a manual is available to explain how to use it. A tutorial on the code’s interface and capabilities was shown, namely the capability of calculating simultaneously the mass concentration of an arbitrary number of elements in a homogeneous sample (any thickness), with the additional capability of fitting the sample matrix composition. This may be done by using as an initial estimate either the results from another analytical technique such as PIXE (usually used as a complementary technique) or with prior knowledge of the main chemical composition. Regarding the development of a routine to perform depth profile measurements, the main aspects of what was already done were presented: 1. the routine was developed to be used interactively, as RUMP, or SigmaNRA, by comparing the calculated and experimental results for each concentration distribution given by the user; 2. the routine uses a division of the target into layers (as in the case of ERYA bulk) but within each layer the projectiles have an energy distribution and not a single energy value (as in the case of ERYA bulk); this implies that depth together with average energy must be calculated for every layer; 3. the energy distribution takes into account Beam Energy Resolution, Beam Energy Straggling and Doppler Broadening; 4. in order to implement energy straggling calculations, Landau, Vavilov and Gaussian distributions are used; 5. the resonant cross section function may be replaced by an ideal Breit-Wigner function; further efforts to implement the code to use resonance strengths are being developed; 6. the concentration may be given for any number of discrete layers or as a depth dependent continuous function. This profile routine is already working with a user-friendly interface, which was also presented. Further tests and improvements are

Depth profile and interface analysis in the nm-range

International Nuclear Information System (INIS)

Oswald, S.; Reiche, R.; Zier, M.; Baunack, S.; Wetzig, K.

2005-01-01

In modern technology, thin films are shrinking more and more to a thickness of few nanometers. Analytical investigations of such thin films using the traditional sputter depth profiling, sputtering in combination with surface-analytical techniques, have limitations due to physical effects especially for very thin films. These limitations are pointed out and some alternatives are discussed. Non-destructive analysis with angle-resolved X-ray photoelectron spectroscopy is demonstrated to be a useful method for such investigations. Both qualitative and quantitative results can be obtained even for complex layer structures. Nevertheless, there are also limitations of this method and some alternatives or complementary methods are considered

Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

International Nuclear Information System (INIS)

Alfeld, Matthias; Broekaert, José A.C.

2013-01-01

Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings

Depth profiling of hydrogen in ferritic/martensitic steels by means of a tritium imaging plate technique

International Nuclear Information System (INIS)

Otsuka, Teppei; Tanabe, Tetsuo

2013-01-01

Highlights: ► We applied a tritium imaging plate technique to depth profiling of hydrogen in bulk. ► Changes of hydrogen depth profiles in the steel by thermal annealing were examined. ► We proposed a release model of plasma-loaded hydrogen in the steel. ► Hydrogen is trapped at trapping sites newly developed by plasma loading. ► Hydrogen is also trapped at surface oxides and hardly desorbed by thermal annealing. -- Abstract: In order to understand how hydrogen loaded by plasma in F82H is removed by annealing at elevated temperatures in vacuum, depth profiles of plasma-loaded hydrogen were examined by means of a tritium imaging plate technique. Owing to large hydrogen diffusion coefficients in F82H, the plasma-loaded hydrogen easily penetrates into a deeper region becoming solute hydrogen and desorbs by thermal annealing in vacuum. However the plasma-loading creates new hydrogen trapping sites having larger trapping energy than that for the intrinsic sites beyond the projected range of the loaded hydrogen. Some surface oxides also trap an appreciable amount of hydrogen which is more difficult to remove by the thermal annealing

Estimating cumulative soil accumulation rates with in situ-produced cosmogenic nuclide depth profiles

International Nuclear Information System (INIS)

Phillips, William M.

2000-01-01

A numerical model relating spatially averaged rates of cumulative soil accumulation and hillslope erosion to cosmogenic nuclide distribution in depth profiles is presented. Model predictions are compared with cosmogenic 21 Ne and AMS radiocarbon data from soils of the Pajarito Plateau, New Mexico. Rates of soil accumulation and hillslope erosion estimated by cosmogenic 21 Ne are significantly lower than rates indicated by radiocarbon and regional soil-geomorphic studies. The low apparent cosmogenic erosion rates are artifacts of high nuclide inheritance in cumulative soil parent material produced from erosion of old soils on hillslopes. In addition, 21 Ne profiles produced under conditions of rapid accumulation (>0.1 cm/a) are difficult to distinguish from bioturbated soil profiles. Modeling indicates that while 10 Be profiles will share this problem, both bioturbation and anomalous inheritance can be identified with measurement of in situ-produced 14 C

Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

Science.gov (United States)

Eijt, S. W. H.; Kind, R.; Singh, S.; Schut, H.; Legerstee, W. J.; Hendrikx, R. W. A.; Svetchnikov, V. L.; Westerwaal, R. J.; Dam, B.

2009-02-01

We report positron depth-profiling studies on the hydrogen sorption behavior and phase evolution of Mg-based thin films. We show that the main changes in the depth profiles resulting from the hydrogenation to the respective metal hydrides are related to a clear broadening in the observed electron momentum densities in both Mg and Mg2Ni films. This shows that positron annihilation methods are capable of monitoring these metal-to-insulator transitions, which form the basis for important applications of these types of films in switchable mirror devices and hydrogen sensors in a depth-sensitive manner. Besides, some of the positrons trap at the boundaries of columnar grains in the otherwise nearly vacancy-free Mg films. The combination of positron annihilation and x-ray diffraction further shows that hydrogen loading at elevated temperatures, in the range of 480-600 K, leads to a clear Pd-Mg alloy formation of the Pd catalyst cap layer. At the highest temperatures, the hydrogenation induces a partial delamination of the ˜5 nm thin capping layer, as sensitively monitored by positron depth profiling of the fraction of ortho-positronium formed at interface with the cap layer. The delamination effectively blocks the hydrogen cycling. In Mg-Si bilayers, we investigated the reactivity upon hydrogen loading and heat treatments near 480 K, which shows that Mg2Si formation is fast relative to MgH2. The combination of positron depth profiling and transmission electron microscopy shows that hydrogenation promotes a complete conversion to Mg2Si for this destabilized metal hydride system, while a partially unreacted, Mg-rich amorphous prelayer remains on top of Mg2Si after a single heat treatment in an inert gas environment. Thin film studies indicate that the difficulty of rehydrogenation of Mg2Si is not primarily the result from slow hydrogen dissociation at surfaces, but is likely hindered by the presence of a barrier for removal of Mg from the readily formed Mg2Si.

SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?

Energy Technology Data Exchange (ETDEWEB)

Gorondy-Novak, S. [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France); Jomard, F. [Groupe d' Etude de la Matière Condensée, CNRS, UVSQ, 45 avenue des Etats-Unis, 78035 Versailles cedex (France); Prima, F. [PSL Research University, Chimie ParisTech – CNRS, Institut de Recherche de Chimie Paris, 75005 Paris (France); Lefaix-Jeuland, H., E-mail: helene.lefaix@cea.fr [CEA, DEN, Service de Recherches de Métallurgie Physique, Université Paris-Saclay, F-91191 Gif-sur-Yvette (France)

2017-05-01

Reliable He profiles are highly desirable for better understanding helium behavior in materials for future nuclear applications. Recently, Secondary Ions Mass Spectrometry (SIMS) allowed the characterization of helium distribution in as-implanted metallic systems. The Cs{sup +} primary ion beam coupled with CsHe{sup +} molecular detector appeared to be a promising technique which overcomes the very high He ionization potential. In this study, {sup 4}He depth profiles in pure body centered cubic (bcc) metals (V, Fe, Ta, Nb and Mo) as-implanted and annealed, were obtained by SIMS. All as-implanted samples exhibited a projected range of around 200 nm, in agreement with SRIM theoretical calculations. After annealing treatment, SIMS measurements evidenced the evolution of helium depth profile with temperature. The latter SIMS results were compared to the helium bubble distribution obtained by Transmission Electron Microscopy (TEM). This study confirmed the great potential of this experimental procedure as a He-depth profiling technique in bcc metals. Indeed, the methodology described in this work could be extended to other materials including metallic and non-metallic compounds. Nevertheless, the quantification of helium concentration after annealing treatment by SIMS remains uncertain probably due to the non-uniform ionization efficiency in samples containing large bubbles.

Nanometric resolution in glow discharge optical emission spectroscopy and Rutherford backscattering spectrometry depth profiling of metal (Cr, Al) nitride multilayers

International Nuclear Information System (INIS)

Escobar Galindo, R.; Gago, R.; Fornies, E.; Munoz-Martin, A.; Climent Font, A.; Albella, J.M.

2006-01-01

In this work, we address the capability of glow discharge optical emission spectroscopy (GDOES) for fast and accurate depth profiling of multilayer nitride coatings down to the nanometer range. This is shown by resolving the particular case of CrN/AlN structures with individual thickness ranging from hundreds to few nanometers. In order to discriminate and identify artefacts in the GDOES depth profile due to the sputtering process, the layered structures were verified by Rutherford backscattering spectrometry (RBS) and scanning electron microscopy (SEM). The interfaces in the GDOES profiles for CrN/AlN structures are sharper than the ones measured for similar metal multilayers due to the lower sputtering rate of the nitrides. However, as a consequence of the crater shape, there is a linear degradation of the depth resolution with depth (approximately 40 nm/μm), saturating at a value of approximately half the thickness of the thinner layer. This limit is imposed by the simultaneous sputtering of consecutive layers. The ultimate GDOES depth resolution at the near surface region was estimated to be of 4-6 nm

Development of an ion time-of-flight spectrometer for neutron depth profiling

Science.gov (United States)

Cetiner, Mustafa Sacit

Ion time-of-flight spectrometry techniques are investigated for applicability to neutron depth profiling. Time-of-flight techniques are used extensively in a wide range of scientific and technological applications including energy and mass spectroscopy. Neutron depth profiling is a near-surface analysis technique that gives concentration distribution versus depth for certain technologically important light elements. The technique uses thermal or sub-thermal neutrons to initiate (n, p) or (n, alpha) reactions. Concentration versus depth distribution is obtained by the transformation of the energy spectrum into depth distribution by using stopping force tables of the projectiles in the substrate, and by converting the number of counts into concentration using a standard sample of known dose value. Conventionally, neutron depth profiling measurements are based on charged particle spectrometry, which employs semiconductor detectors such as a surface barrier detector (SBD) and the associated electronics. Measurements with semiconductor detectors are affected by a number of broadening mechanisms, which result from the interactions between the projectile ion and the detector material as well as fluctuations in the signal generation process. These are inherent features of the detection mechanism that involve the semiconductor detectors and cannot be avoided. Ion time-of-flight spectrometry offers highly precise measurement capabilities, particularly for slow particles. For high-energy low-mass particles, measurement resolution tends to degrade with all other parameters fixed. The threshold for more precise ion energy measurements with respect to conventional techniques, such as direct energy measurement by a surface barrier detector, is directly related to the design and operating parameters of the device. Time-of-flight spectrometry involves correlated detection of two signals by a coincidence unit. In ion time-of-flight spectroscopy, the ion generates the primary input

Defect and dopant depth profiles in boron-implanted silicon studied with channeling and nuclear reaction analysis

NARCIS (Netherlands)

Vos, M.; Boerma, D.O.; Smulders, P.J.M.; Oosterhoff, S.

1986-01-01

Single crystals of silicon were implanted at RT with 1 MeV boron ions to a dose of 1 × 1015 ions/cm2. The depth profile of the boron was measured using the 2060-keV resonance of the 11B(α, n)14N nuclear reaction. The distribution of the lattice disorder as a function of depth was determined from

Narrow nuclear resonance profiling of Al with subnanometric depth resolution

International Nuclear Information System (INIS)

Rosa, E.B.O. da; Krug, C.; Stedile, F.C.; Morais, J.; Baumvol, I.J.R.

2002-01-01

We report on the use of the narrow and isolated resonance at 404.9 keV in the cross-section curve of the 27 Al(p,γ) 28 Si nuclear reaction for profiling Al in ultrathin aluminum oxide films on Si. The samples were characterized as-deposited and after thermal annealing, so that Al transport could be studied. An estimated depth resolution of approximately 0.4 nm near the surface of the films could be obtained owing to: (i) the very small resonance width; (ii) the high stopping power of Al 2 O 3 for 404.9 keV protons; (iii) the high energy stability of the proton beam provided by the 500 kV HVEE ion implanter at Porto Alegre; and (iv) an apparent thickness magnification by a factor between 2.0 and 2.4 with the use of glancing incidence. This technique is compared to other methods for Al profiling like medium energy ion scattering and some sputtering-based techniques

A continuous OSL scanning method for analysis of radiation depth-dose profiles in bricks

DEFF Research Database (Denmark)

Bøtter-Jensen, L.; Jungner, H.; Poolton, N.R.J.

1995-01-01

This article describes the development of a method for directly measuring radiation depth-dose profiles from brick, tile and porcelain cores, without the need for sample separation techniques. For the brick cores, examples are shown of the profiles generated by artificial irradiation using...... the different photon energies from Cs-137 and Co-60 gamma sources; comparison is drawn with both the theoretical calculations derived from Monte Carlo simulations, as well as experimental measurements made using more conventional optically stimulated luminescence methods of analysis....

Mobile depth profiling and sub-surface imaging techniques for historical paintings—A review

Energy Technology Data Exchange (ETDEWEB)

Alfeld, Matthias, E-mail: matthias.alfeld@desy.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany); University of Antwerp, Department of Chemistry, Groenenbrogerlaan 171, B-2020 Antwerp (Belgium); Broekaert, José A.C., E-mail: jose.broekaert@chemie.uni-hamburg.de [University of Hamburg, Department of Chemistry, Martin-Luther-King Platz 6, D-20146 Hamburg (Germany)

2013-10-01

Hidden, sub-surface paint layers and features contain valuable information for the art-historical investigation of a painting's past and for its conservation for coming generations. The number of techniques available for the study of these features has been considerably extended in the last decades and established techniques have been refined. This review focuses on mobile non-destructive subsurface imaging and depth profiling techniques, which allow for the in-situ investigation of easel paintings, i.e. paintings on a portable support. Among the techniques discussed are: X-ray radiography and infrared reflectography, which are long established methods and are in use for several decades. Their capabilities of element/species specific imaging have been extended by the introduction of energy/wavelength resolved measurements. Scanning macro-X-ray fluorescence analysis made it for the first time possible to acquire elemental distribution images in-situ and optical coherence tomography allows for the non-destructive study the surface paint layers in virtual cross-sections. These techniques and their variants are presented next to other techniques, such as Terahertz imaging, Nuclear Magnetic Resonance depth profiling and established techniques for non destructive testing (thermography, ultrasonic imaging and laser based interference methods) applied in the conservation of historical paintings. Next to selected case studies the capabilities and limitations of the techniques are discussed. - Highlights: • All mobile sub-surface and depth-profiling techniques for paintings are reviewed. • The number of techniques available has increased considerably in the last years. • X-ray radiography and infrared reflectography are still the most used techniques. • Scanning macro-XRF and optical coherence tomography begin to establish. • Industrial non destructive testing techniques support the preservation of paintings.

Determination of the thickness distribution of a graphene layer grown on a 2″ SiC wafer by means of Auger electron spectroscopy depth profiling

International Nuclear Information System (INIS)

Kotis, L.; Gurban, S.; Pecz, B.; Menyhard, M.; Yakimova, R.

2014-01-01

Highlights: • The thickness of graphene grown on SiC was determined by AES depth profiling. • The AES depth profiling verified the presence of buffer layer on SiC. • The presence of unsaturated Si bonds in the buffer layer has been shown. • Using multipoint analysis thickness distribution of the graphene on the wafer was determined. - Abstract: Auger electron spectroscopy (AES) depth profiling was applied for determination of the thickness of a macroscopic size graphene sheet grown on 2 in. 6H-SiC (0 0 0 1) by sublimation epitaxy. The measured depth profile deviated from the expected exponential form showing the presence of an additional, buffer layer. The measured depth profile was compared to the simulated one which allowed the derivation of the thicknesses of the graphene and buffer layers and the Si concentration of buffer layer. It has been shown that the graphene-like buffer layer contains about 30% unsaturated Si. The depth profiling was carried out in several points (diameter 50 μm), which permitted the constructing of a thickness distribution characterizing the uniformity of the graphene sheet

Identification of Chinese medicinal fungus Cordyceps sinensis by depth-profiling mid-infrared photoacoustic spectroscopy

Science.gov (United States)

Du, Changwen; Zhou, Jianmin; Liu, Jianfeng

2017-02-01

With increased demand for Cordyceps sinensis it needs rapid methods to meet the challenge of identification raised in quality control. In this study Cordyceps sinensis from four typical natural habitats in China was characterized by depth-profiling Fourier transform infrared photoacoustic spectroscopy. Results demonstrated that Cordyceps sinensis samples resulted in typical photoacoustic spectral appearance, but heterogeneity was sensed in the whole sample; due to the heterogeneity Cordyceps sinensis was represented by spectra of four groups including head, body, tail and leaf under a moving mirror velocity of 0.30 cm s- 1. The spectra of the four groups were used as input of a probabilistic neural network (PNN) to identify the source of Cordyceps sinensis, and all the samples were correctly identified by the PNN model. Therefore, depth-profiling Fourier transform infrared photoacoustic spectroscopy provides novel and unique technique to identify Cordyceps sinensis, which shows great potential in quality control of Cordyceps sinensis.

Depth profiling of superconducting thin films using rare gas ion sputtering with laser postionization

International Nuclear Information System (INIS)

Pallix, J.B.; Becker, C.H.; Missert, N.; Char, K.; Hammond, R.H.

1988-01-01

Surface analysis by laser ionization (SALI) has been used to examine a high-T/sub c/ superconducting thin film of nominal composition YBa 2 Cu 3 O 7 deposited on SrTiO 3 (100) by reactive magnetron sputtering. The main focus of this work was to probe the compositional uniformity and the impurity content throughout the 1800 A thick film having critical current densities of 1 to 2 x 10 6 A/cm 2 . SALI depth profiles show this film to be more uniform than thicker films (∼1 μm, prepared by electron beam codeposition) which were studied previously, yet the data show that some additional (non-superconducting) phases derived from Y, Ba, Cu, and O are still present. These additional phases are studied by monitoring the atomic and diatomic-oxide photoion profiles and also the depth profiles of various clusters (e.g. Y 2 O 2 + , Y 2 O 3 + , Y 3 O 4 + , Ba 2 O + , Ba 2 O 2 + , BaCu + , BaCuO + , YBaO 2 + , YSrO 2 + , etc.). A variety of impurities are observed to occur throughout the film including rather large concentrations of Sr. Hydroxides, F, Cl, and CO/sub x/ are evident particularly in the sample's near surface region (the top ∼100 A)

Depth profiling of superconducting thin films using rare gas ion sputtering with laser postionization

Science.gov (United States)

Pallix, J. B.; Becker, C. H.; Missert, N.; Char, K.; Hammond, R. H.

1988-02-01

Surface analysis by laser ionization (SALI) has been used to examine a high-Tc superconducting thin film of nominal composition YBa2Cu3O7 deposited on SrTiO3 (100) by reactive magnetron sputtering. The main focus of this work was to probe the compositional uniformity and the impurity content throughout the 1800 Å thick film having critical current densities of 1 to 2×106 A/cm2. SALI depth profiles show this film to be more uniform than thicker films (˜1 μm, prepared by electron beam codeposition) which were studied previously, yet the data show that some additional (non-superconducting) phases derived from Y, Ba, Cu, and O are still present. These additional phases are studied by monitoring the atomic and diatomic-oxide photoion profiles and also the depth profiles of various clusters (e.g. Y2O2+, Y2O3+, Y3O4+, Ba2O+, Ba2O2+, BaCu+, BaCuO+, YBaO2+, YSrO2+, etc.). A variety of impurities are observed to occur throughout the film including rather large concentrations of Sr. Hydroxides, F, Cl, and COx are evident particularly in the sample's near surface region (the top ˜100 Å).

Sediment mixing and accumulation rate effects on radionuclide depth profiles in Hudson estuary sediments

International Nuclear Information System (INIS)

Olsen, C.R.; Simpson, H.J.; Peng, T.; Bopp, R.F.; Trier, R.M.

1981-01-01

Measured anthropogenic radionuclide profiles in sediment cores from the Hudson River estuary were compared with profiles computed by using known input histories of radionuclides to the estuary and mixing coefficients which decreased exponentially with depth in the sediment. Observed 134 Cs sediment depth profiles were used in the mixing rate computation because reactor releases were the only significant source for this nuclide, whereas the inputs of 137 Cs and /sup 239.240/Pu to the estuary were complicated by runoff or erosion in upstream areas, in addition to direct fallout from precipitation. Our estimates for the rates of surface sediment mixing in the low salinity reach of the estuary range from 0.25 to 1 cm 2 /yr, or less. In some areas of the harbor adjacent to New York City, were fine-particle accumulation rates are generally >3 cm/yr, and often as high as 10 to 20 cm/yr, sediment mixing rates as high as 10 cm 2 /yr would have little effect on radionuclide peak distributions. Consequently, anthropogenic radionuclide maximum activities in subsurface sediments of the Hudson appear to be useful as time-stratigraphic reference levels, which can be correlated with periods of maximum radionuclide inputs for estimating rates and patterns of sediment accumulation

Acclimation to different depths by the marine angiosperm Posidonia oceanica: transcriptomic and proteomic profiles

Directory of Open Access Journals (Sweden)

Emanuela eDattolo

2013-06-01

Full Text Available For seagrasses, seasonal and daily variations in light and temperature represent the mains factors driving their distribution along the bathymetric cline. Changes in these environmental factors, due to climatic and anthropogenic effects, can compromise their survival. In a framework of conservation and restoration, it becomes crucial to improve our knowledge about the physiological plasticity of seagrass species along environmental gradients. Here, we aimed to identify differences in transcriptomic and proteomic profiles, involved in the acclimation along the depth gradient in the seagrass Posidonia oceanica, and to improve the available molecular resources in this species, which is an important requisite for the application of eco-genomic approaches. To do that, from plant growing in the shallow (-5m and a deep (-25m portions of a single meadow, (i we generated two reciprocal EST (Expressed Sequences Tags libraries using a Suppressive Subtractive Hybridization (SSH approach, to obtain depth/specific transcriptional profiles, and (ii we identified proteins differentially expressed, using the highly innovative USIS mass spectrometry methodology, coupled with 1D-SDS electrophoresis and labeling free approach. Mass spectra were searched in the open source Global Proteome Machine (GPM engine against plant databases and with the X!Tandem algorithm against a local database. Transcriptional analysis showed both quantitative and qualitative differences between depths. EST libraries had only the 3% of transcripts in common. A total of 315 peptides belonging to 64 proteins were identified by mass spectrometry. ATP synthase subunits were among the most abundant proteins in both conditions. Both approaches identified genes and proteins in pathways related to energy metabolism, transport and genetic information processing, that appear o be the most involved in depth acclimation in P. oceanica. Their putative rules in acclimation to depth were discussed.

Acclimation to different depths by the marine angiosperm Posidonia oceanica: transcriptomic and proteomic profiles.

Science.gov (United States)

Dattolo, Emanuela; Gu, Jenny; Bayer, Philipp E; Mazzuca, Silvia; Serra, Ilia A; Spadafora, Antonia; Bernardo, Letizia; Natali, Lucia; Cavallini, Andrea; Procaccini, Gabriele

2013-01-01

For seagrasses, seasonal and daily variations in light and temperature represent the mains factors driving their distribution along the bathymetric cline. Changes in these environmental factors, due to climatic and anthropogenic effects, can compromise their survival. In a framework of conservation and restoration, it becomes crucial to improve our knowledge about the physiological plasticity of seagrass species along environmental gradients. Here, we aimed to identify differences in transcriptomic and proteomic profiles, involved in the acclimation along the depth gradient in the seagrass Posidonia oceanica, and to improve the available molecular resources in this species, which is an important requisite for the application of eco-genomic approaches. To do that, from plant growing in shallow (-5 m) and deep (-25 m) portions of a single meadow, (i) we generated two reciprocal Expressed Sequences Tags (EST) libraries using a Suppressive Subtractive Hybridization (SSH) approach, to obtain depth/specific transcriptional profiles, and (ii) we identified proteins differentially expressed, using the highly innovative USIS mass spectrometry methodology, coupled with 1D-SDS electrophoresis and labeling free approach. Mass spectra were searched in the open source Global Proteome Machine (GPM) engine against plant databases and with the X!Tandem algorithm against a local database. Transcriptional analysis showed both quantitative and qualitative differences between depths. EST libraries had only the 3% of transcripts in common. A total of 315 peptides belonging to 64 proteins were identified by mass spectrometry. ATP synthase subunits were among the most abundant proteins in both conditions. Both approaches identified genes and proteins in pathways related to energy metabolism, transport and genetic information processing, that appear to be the most involved in depth acclimation in P. oceanica. Their putative rules in acclimation to depth were discussed.

Dechanneling measurements of defect depth profiles and effective cross-channel distribution of misaligned atoms in ion irradiated gold

International Nuclear Information System (INIS)

Pronko, P.P.

1975-01-01

Defect depth profiles for self ion and He + irradiated gold are obtained from single and multiple scatter dechanneling analysis in single crystal gold films. Quantitative defect densities are obtained through use of atomic scattering cross sections. Integral damage profiles are extracted from the dechanneling spectra and subsequently differentiated to yield the volume concentration of defects as a function of depth. Results from the self ion irradiations suggest that incident ions produce defect distributions across depths much greater than predicted by random stopping theory. This is in agreement with TEM observations of others. Comparison of the experimental profiles is made with theoretical vacancy distributions predicted by defect diffusion in a radiation environment. Similarities are observed for the low fluence irradiations suggesting that profile characteristics may be controlled by rapid migration and loss of interstitials to the film surfaces during irradiation. Information on the across-channel distribution of misaligned atoms in the damaged films is obtained with the steady increase of transverse energy model applied to the dechanneling spectra. A predominance of slight misalignment is observed with no contribution to dechanneling coming from atoms displaced significantly close to the center of the channels. This is in keeping with what is expected for crystal distortions caused by the strain fields associated with vacancy cluster defects

Dechanneling measurements of defect depth profiles and effective cross-channel distribution of misaligned atoms in ion-irradiated gold

International Nuclear Information System (INIS)

Pronko, P.P.

1976-01-01

Defect depth profiles for self-ion and He + irradiated gold are obtained from single and multiple scatter dechanneling analysis in single-crystal gold films. Quantitative defect densities are obtained through use of atomic-scattering cross sections. Integral damage profiles are extracted from the dechanneling spectra and subsequently differentiated to yield the volume concentration of defects as a function of depth. Results from the self-ion irradiations suggest that incident ions produce defect distributions across depths much greater than predicted by random stopping theory. This is in agreement with TEM observations of others. Comparison of the experimental profiles is made with theoretical vacancy distributions predicted by defect diffusion in a radiation environment. Similarities are observed for the low-fluence irradiations, suggesting that profile characteristics may be controlled by rapid migration and loss of interstitials to the film surfaces during irradiation. Information on the across-channel distribution of misaligned atoms in the damaged films is obtained with the steady increase of transverse energy model. A predominance of slight misalignment is observed with no contribution to dechanneling coming from atoms displaced significantly close to the center of the channels. This is in keeping with what is expected for crystal distortions caused by the strain fields associated with vacancy cluster defects. (Auth.)

Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se{sub 2} thin solar cell film using laser-induced breakdown spectroscopy

Energy Technology Data Exchange (ETDEWEB)

In, Jung-Hwan; Kim, Chan-Kyu; Lee, Seok-Hee; Choi, Jang-Hee; Jeong, Sungho, E-mail: shjeong@gist.ac.kr

2015-03-31

Laser-induced breakdown spectroscopy (LIBS) is reported as a method for rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se{sub 2} (CIGS) thin film. A calibration model considering compositional grading over depth was developed and verified with test samples. The results from eight test samples showed that the average concentration of Cu, In, Ga and Se could be predicted with a root mean square error of below 1% and a relative standard deviation of also below 1%. The depth profile of each constituent element of CIGS predicted by LIBS was close to those by Auger electron spectroscopy and secondary ion mass spectrometry. The average ablation depth per pulse during depth profiling was about 100 nm. - Highlights: • LIBS was adopted for quantitative analysis of CIGS thin film. • A calibration model considering compositional grading over depth was developed. • Concentration prediction of CIGS thin film was accurate and precise. • Quantitative depth profiling by LIBS was compared with those by AES and SIMS.

Physical mechanisms of thermal-diffusivity depth-profile generation in a hardened low-alloy Mn, Si, Cr, Mo steel reconstructed by photothermal radiometry

International Nuclear Information System (INIS)

Nicolaides, Lena; Mandelis, Andreas; Beingessner, Clare J.

2001-01-01

It is well established that in hardened steels thermal-diffusivity broadly anticorrelates with microhardness, allowing thermal-wave depth profilometry to be used as a tool to measure microhardness profiles. Nevertheless, the physical mechanisms for this anticorrelation have not been well understood. In this work, the thermal-diffusivity profiles of rough, hardened industrial steels were reconstructed after the elimination of roughness effects from the experimental data. Carburizing and quenching are widely used for the heat treatment of steel components, and it is important to understand their effects on thermal-diffusivity profiles. A thorough examination of the actual mechanism by which thermal-diffusivity depth profiles are affected by first carburizing and then quenching AISI-8620 steels was performed. It was concluded that the variation of thermal diffusivity with depth is dominated by the carbon concentration profile, whereas the absolute value of the thermal diffusivity is a function of microstructure. [copyright] 2001 American Institute of Physics

Tailoring the stress-depth profile in thin films; the case of γ'-Fe4N1-x

International Nuclear Information System (INIS)

Wohlschloegel, M.; Welzel, U.; Mittemeijer, E.J.

2011-01-01

Homogeneous γ'-Fe 4 N 1-x thin films were produced by gas through-nitriding of iron thin films (thickness 800 nm) deposited onto Al 2 O 3 substrates by Molecular Beam Epitaxy. The nitriding parameters were chosen such that the nitrogen concentration within the γ' thin films was considerably lower (x ∼ 0.05) than the stoichiometric value (x = 0). X-ray diffraction stress analysis at constant penetration depths performed after the nitriding step revealed the presence of tensile stress parallel to the surface; the tensile stress was shown to be practically constant over the entire film thickness. For further nitriding treatments, the parameters were adjusted such that nitrogen enrichment occurred near the specimen surface. The depth-dependent nitrogen enrichment could be monitored by evaluating the strain-free lattice parameter of γ' as a function of X-ray penetration depth and relating it to the nitrogen concentration employing a direct relation between lattice parameter and nitrogen concentration. The small compositional variations led to distinct characteristic stress-depth profiles. The stress changes non-monotonously with depth in the film as could be shown by non-destructive X-ray diffraction stress analysis at constant penetration depths. This work demonstrates that by a specific choice of a first and a subsequent nitriding treatment (employing different nitriding potentials and/or different temperatures for both treatments) controlled development of residual stress profiles is possible in thin iron-nitride surface layers.

Quantitative Auger depth profiling of LPCVD and PECVD silicon nitride films

International Nuclear Information System (INIS)

Keim, E.G.; Aite, K.

1989-01-01

Thin silicon nitride films (100-210 nm) with refractive indices varying from 1.90 to 2.10 were deposited on silicon substrates by low pressure chemical vapour deposition (LPCVD) and plasma enhanced chemical vapour deposition (PECVD). Rutherford backscattering spectrometry (RBS), ellipsometry, surface profiling measurements and Auger electron spectroscopy (AES) in combination with Ar + sputtering were used to characterize these films. We have found that the use of (p-p)heights of the Si LVV and N KLL Auger transitions in the first derivative of the energy distribution (dN(E)/dE) leads to an accurate determination of the silicon nitride composition in Auger depth profiles over a wide range of atomic Si/N ratios. Moreover, we have shown that the Si KLL Auger transition, generally considered to be a better probe than the low energy Si LVV Auger transition in determining the chemical composition of silicon nitride layers, leads to deviating results. (orig.)

Characterizing contaminant concentrations with depth by using the USGS well profiler in Oklahoma, 2003-9

Science.gov (United States)

Smith, S. Jerrod; Becker, Carol J.

2011-01-01

Since 2003, the U.S. Geological Survey (USGS) Oklahoma Water Science Center has been using the USGS well profiler to characterize changes in water contribution and contaminant concentrations with depth in pumping public-supply wells in selected aquifers. The tools and methods associated with the well profiler, which were first developed by the USGS California Water Science Center, have been used to investigate common problems such as saline water intrusion in high-yield irrigation wells and metals contamination in high-yield public-supply wells.

Depth profiling of residual activity of ^{237}U fragments as a range verification technique for ^{238}U primary ion beam

Directory of Open Access Journals (Sweden)

I. Strašík

2012-07-01

Full Text Available Experimental and simulation data concerning fragmentation of ^{238}U ion beam in aluminum, copper, and stainless-steel targets with the initial energy 500 and 950  MeV/u are collected in the paper. A range-verification technique based on depth profiling of residual activity is presented. The irradiated targets were constructed in the stacked-foil geometry and analyzed using gamma-ray spectroscopy. One of the purposes of these experiments was depth profiling of residual activity of induced nuclides and projectile fragments. Among the projectile fragments, special attention is paid to the ^{237}U isotope that has a range very close to the range of the primary ^{238}U ions. Therefore, the depth profiling of the ^{237}U isotope can be utilized for experimental verification of the ^{238}U primary-beam range, which is demonstrated and discussed in the paper. The experimental data are compared with computer simulations by FLUKA, SRIM, and ATIMA, as well as with complementary experiments.

In situ neutron depth profiling: A powerful method to probe lithium transport in micro-batteries

NARCIS (Netherlands)

Oudenhoven, J.F.M.; Labohm, F.; Mulder, M.; Niessen, R.A.H.; Mulder, F.M.; Notten, P.H.L.

2011-01-01

In situ neutron depth profiling (NDP) offers the possibility to observe lithium transport inside micro-batteries during battery operation. It is demonstrated that NDP results are consistent with the results of electrochemical measurements, and that the use of an enriched6LiCoO2 cathode offers more

Depth profiles of defects in Ar-iondashirradiated steels determined by a least-squares fit of S parameters from variable-energy positron annihilation

Science.gov (United States)

Aruga, Takeo; Takamura, Saburo; Nakata, Kiyotomo; Ito, Yasuo

1995-01-01

Using a new method for reconstructing the depth profile of defects in an iondashirradiated sample by using slow positrons, the depth profiles of vacancy-type defects in 316 stainless steel samples, irradiated with 250 keV Ar ions to a dose of 7.5 × 10 19 m -2 at room temperature, have been calculated from Doppler-broadening S parameters measured as a function of positron energies up to 16 keV. Without assuming any type of shape for the defect profiles, such as Gaussian, the defect profiling is done using a least-squares fitting method. The resulting profile suggests that in as-irradiated 316 stainless steel samples with lower carbon content, the defect distribution peaks at a depth four times larger than that of the ion range. After annealing at a high temperature of 1253 K for 0.5 h, the fitted profile shows that the peak around the average ion range is highly enhanced. While in the steel added with 0.3 wt% titanium, the profile exhibits almost no peak after annealing at 1073 K. The results indicate that the radiationdashproduced vacancy clusters are stabilized by the implanted Ar atoms more effectively in the Ti-free steel than in the Ti-added steel.

RBS and NRA of cobalt oxide thin films prepared by the sol-gel process

International Nuclear Information System (INIS)

Andrade, E.; Huerta, L.; Pineda, J.C.; Zavala, E.P.; Barrera, E.; Rocha, M. F.; Vargas, C.A.

2001-01-01

This work presents a study of cobalt oxide thin films produced by the sol-gel process on aluminum and glass substrates. These films have been analyzed using two ion beam analysis (IBA) techniques: a) a standard RBS 4 He 2 MeV and b) nuclear reaction analysis (NRA) using a 1 MeV deuterium beam. The 12 C(d,p 0 ) 13 C nuclear reaction provides information that carbon is incorporated into the film structure, which could be associated to the sinterization film process. Other film measurements such as optical properties, XRD, and SEM were performed in order to complement the IBA analysis. The results show that cobalt oxide film coatings prepared by this technique have good optical properties as solar absorbers and potential uses in solar energy applications

Distribution of 137Cs in benthic plants along depth profiles in the outer Puck Bay (Baltic Sea)

International Nuclear Information System (INIS)

Tamara Zalewska

2012-01-01

A study was conducted on three macroalgae species: Polysiphonia fucoides and Furcellaria lumbricalis, the species of the red algae division, and Cladophora glomerata, representing the green algae division, as well as Zostera marina, representing vascular plants. The main aim of the study was to recognize the level of 137 Cs concentrations in the plants, which could be used as a measurement of bioaccumulation efficiency in the selected macrophytes at varying depths, and in the seasonal resolution of the vegetation period: spring-summer and autumnal. The plants' biomass clearly showed seasonal variability, as did the 137 Cs concentrations in the plants. Cesium activity also changed with depth. Seasonal variability in radionuclide content in the plants, as well as the differences in its activity determined along the depth profile, were related mainly to the plant biomass and the dilution effect caused by the biomass increment and reflected the growth dynamics. P. fucoides showed much greater bioaccumulation ability at each depth as compared to C. glomerata, a green algae. Lower concentrations of 137 Cs were also identified in F. lumbricalis and in Z. marina, mostly as a result of differences in morphology and physiology. P. fucoides can be recommended as a bioindicator for the monitoring of 137 Cs contamination due to the high efficiency of bioaccumulation and the available biomass along the depth profile, as well as the occurrence throughout the entire vegetation season. (author)

Degradation effects ad Si-depth profiling in photoresists using ion beam analysis

International Nuclear Information System (INIS)

Ijzendoorn, L.J. van; Schellekens, J.P.W.

1989-01-01

The reaction of silicon-containing vapour with a photoresist layer, as used in dry developable lithographic processes, was studied with Rutherford backscattering spectrometry (RBS). Degradation of the polymer layer was observed, but the total amount of incorporated Si was found to be constant during the measurement. Si-depth profiles were found to be independent of dose and in agreement with profiles obtained with secondary ion mass spectrometry (SIMS). The detection of hydrogen by elastic recoil detection (ERD) was used to study the degradation in detail. The decrease in hydrogen countrate from a layer of polystyrene on Si in combination with the shift of the Si-substrate edge in the corresponding RBS spectra was used for a model description. Only one degradation cross-section for hydrogen and one for carbon, both independent of beam current and dose, were required for a successful fit of the experimental data. (orig.)

On-the-fly depth profiling during ablation with ultrashort laser pulses: A tool for accurate micromachining and laser surgery

International Nuclear Information System (INIS)

Lausten, Rune; Balling, Peter

2001-01-01

A method for accurate depth profiling of a region subjected to ablation with ultrashort laser pulses is demonstrated. Time-gated imaging of the backscattered radiation from the ablation region is performed in a geometry, which allows the depth along a chosen axis on the sample to be determined with a single measurement. The profiling system has a spatial resolution of a few micrometers and applications are promoted by the fact that the measurement is performed with the same pulse that undertakes ablation. This also indicates that the method is inherently suited for in situ on-the-fly measurements. Copyright 2001 American Institute of Physics

DS86 neutron dose. Monte Carlo analysis for depth profile of {sup 152}Eu activity in a large stone sample

Energy Technology Data Exchange (ETDEWEB)

Endo, Satoru; Hoshi, Masaharu; Takada, Jun [Hiroshima Univ. (Japan). Research Inst. for Radiation Biology and Medicine; Iwatani, Kazuo; Oka, Takamitsu; Shizuma, Kiyoshi; Imanaka, Tetsuji; Fujita, Shoichiro; Hasai, Hiromi

1999-06-01

The depth profile of {sup 152}Eu activity induced in a large granite stone pillar by Hiroshima atomic bomb neutrons was calculated by a Monte Carlo N-Particle Transport Code (MCNP). The pillar was on the Motoyasu Bridge, located at a distance of 132 m (WSW) from the hypocenter. It was a square column with a horizontal sectional size of 82.5 cm x 82.5 cm and height of 179 cm. Twenty-one cells from the north to south surface at the central height of the column were specified for the calculation and {sup 152}Eu activities for each cell were calculated. The incident neutron spectrum was assumed to be the angular fluence data of the Dosimetry System 1986 (DS86). The angular dependence of the spectrum was taken into account by dividing the whole solid angle into twenty-six directions. The calculated depth profile of specific activity did not agree with the measured profile. A discrepancy was found in the absolute values at each depth with a mean multiplication factor of 0.58 and also in the shape of the relative profile. The results indicated that a reassessment of the neutron energy spectrum in DS86 is required for correct dose estimation. (author)

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Directory of Open Access Journals (Sweden)

Patrick Philipp

2016-11-01

Full Text Available The analysis of polymers by secondary ion mass spectrometry (SIMS has been a topic of interest for many years. In recent years, the primary ion species evolved from heavy monatomic ions to cluster and massive cluster primary ions in order to preserve a maximum of organic information. The progress in less-damaging sputtering goes along with a loss in lateral resolution for 2D and 3D imaging. By contrast the development of a mass spectrometer as an add-on tool for the helium ion microscope (HIM, which uses finely focussed He+ or Ne+ beams, allows for the analysis of secondary ions and small secondary cluster ions with unprecedented lateral resolution. Irradiation induced damage and depth profiling capabilities obtained with these light rare gas species have been far less investigated than ion species used classically in SIMS. In this paper we simulated the sputtering of multi-layered polymer samples using the BCA (binary collision approximation code SD_TRIM_SP to study preferential sputtering and atomic mixing in such samples up to a fluence of 1018 ions/cm2. Results show that helium primary ions are completely inappropriate for depth profiling applications with this kind of sample materials while results for neon are similar to argon. The latter is commonly used as primary ion species in SIMS. For the two heavier species, layers separated by 10 nm can be distinguished for impact energies of a few keV. These results are encouraging for 3D imaging applications where lateral and depth information are of importance.

Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Energy Technology Data Exchange (ETDEWEB)

Steinberger, R., E-mail: roland.steinberger@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Celedón, C.E., E-mail: carlos.celedon@usm.cl [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Departamento de Física, Universidad Técnica Federico Santa María, Valaparaíso, Casilla 110-V (Chile); Bruckner, B., E-mail: barbara.bruckner@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Roth, D., E-mail: dietmar.roth@jku.at [Institut für Experimentalphysik, Abteilung für Atom- und Oberflächenphysik, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Duchoslav, J., E-mail: jiri.duchoslav@jku.at [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); Arndt, M., E-mail: martin.arndt@voestalpine.com [voestalpine Stahl GmbH, voestalpine-Straße 3, 4031 Linz (Austria); Kürnsteiner, P., E-mail: p.kuernsteiner@mpie.de [Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Straße 69, 4040 Linz (Austria); and others

2017-07-31

Highlights: • Investigation on the impact of residual gas prevailing in UHV chambers. • For some metals detrimental oxygen uptake could be observed within shortest time. • Totally different behavior was found: no changes, solely adsorption and oxidation. • The UHV residual gas may severely corrupt results obtained from depth profiling. • A well-considered data acquisition sequence is the key for reliable depth profiles. - Abstract: Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

Lithium diffusion in polyether ether ketone and polyimide stimulated by in situ electron irradiation and studied by the neutron depth profiling method

Science.gov (United States)

Vacik, J.; Hnatowicz, V.; Attar, F. M. D.; Mathakari, N. L.; Dahiwale, S. S.; Dhole, S. D.; Bhoraskar, V. N.

2014-10-01

Diffusion of lithium from a LiCl aqueous solution into polyether ether ketone (PEEK) and polyimide (PI) assisted by in situ irradiation with 6.5 MeV electrons was studied by the neutron depth profiling method. The number of the Li atoms was found to be roughly proportional to the diffusion time. Regardless of the diffusion time, the measured depth profiles in PEEK exhibit a nearly exponential form, indicating achievement of a steady-state phase of a diffusion-reaction process specified in the text. The form of the profiles in PI is more complex and it depends strongly on the diffusion time. For the longer diffusion time, the profile consists of near-surface bell-shaped part due to Fickian-like diffusion and deeper exponential part.

Interdiffusion in epitaxial, single-crystalline Au/Ag thin films studied by Auger electron spectroscopy sputter-depth profiling and positron annihilation

International Nuclear Information System (INIS)

Noah, Martin A.; Flötotto, David; Wang, Zumin; Reiner, Markus; Hugenschmidt, Christoph; Mittemeijer, Eric J.

2016-01-01

Interdiffusion in epitaxial, single-crystalline Au/Ag bilayered thin films on Si (001) substrates was investigated by Auger electron spectroscopy (AES) sputter-depth profiling and by in-situ positron annihilation Doppler broadening spectroscopy (DBS). By the combination of these techniques identification of the role of vacancy sources and sinks on interdiffusion in the Au/Ag films was possible. It was found that with precise knowledge of the concentration-dependent self-diffusion and impurity diffusion coefficients a distinction between the Darken-Manning treatment and Nernst-Planck treatment can be made, which is not possible on the basis of the determined concentration-depth profiles alone.

CREST-SAFE: Snow LST validation, wetness profiler creation, and depth/SWE product development

Science.gov (United States)

Perez Diaz, C. L.; Lakhankar, T.; Romanov, P.; Khanbilvardi, R.; Munoz Barreto, J.; Yu, Y.

2017-12-01

CREST-SAFE: Snow LST validation, wetness profiler creation, and depth/SWE product development The Field Snow Research Station (also referred to as Snow Analysis and Field Experiment, SAFE) is operated by the NOAA Center for Earth System Sciences and Remote Sensing Technologies (CREST) in the City University of New York (CUNY). The field station is located within the premises of the Caribou Municipal Airport (46°52'59'' N, 68°01'07'' W) and in close proximity to the National Weather Service (NWS) Regional Forecast Office. The station was established in 2010 to support studies in snow physics and snow remote sensing. The Visible Infrared Imager Radiometer Suite (VIIRS) Land Surface Temperature (LST) Environmental Data Record (EDR) and Moderate Resolution Imaging Spectroradiometer (MODIS) LST product (provided by the Terra and Aqua Earth Observing System satellites) were validated using in situ LST (T-skin) and near-surface air temperature (T-air) observations recorded at CREST-SAFE for the winters of 2013 and 2014. Results indicate that T-air correlates better than T-skin with VIIRS LST data and that the accuracy of nighttime LST retrievals is considerably better than that of daytime. Several trends in the MODIS LST data were observed, including the underestimation of daytime values and night-time values. Results indicate that, although all the data sets showed high correlation with ground measurements, day values yielded slightly higher accuracy ( 1°C). Additionally, we created a liquid water content (LWC)-profiling instrument using time-domain reflectometry (TDR) at CREST-SAFE and tested it during the snow melt period (February-April) immediately after installation in 2014. Results displayed high agreement when compared to LWC estimates obtained using empirical formulas developed in previous studies, and minor improvement over wet snow LWC estimates. Lastly, to improve on global snow cover mapping, a snow product capable of estimating snow depth and snow water

The national psychological/personality profile of Romanians: An in depth analysis of the regional national psychological/personality profile of Romanians

Directory of Open Access Journals (Sweden)

David, D.

2015-12-01

Full Text Available In this article we perform an in depth analysis of the national psychological/personality profile of Romanians. Following recent developments in the field (see Rentfrow et al., 2013; 2015, we study the regional national psychological/personality profile of Romanians, based on the Big Five model (i.e., NEO PI/R. Using a representative sample (N1 = 1000, we performed a cluster analysis and identified two bipolar personality profiles in the population: cluster 1, called “Factor X-”, characterized by high neuroticism and low levels of extraversion, openness, agreeableness, and conscientiousness, and cluster 2, called “Factor X+”, characterized by the opposite configuration in personality traits, low neuroticism and high levels of extraversion, openness, agreeableness, and conscientiousness. The same two cluster pattern/solution emerged in other samples (N = 2200, with other Big Five-based instruments, and by using various methods of data (e.g., direct vs. reversed item score, controlling for item desirability and cluster (i.e., with and without “running means” analyses. These two profiles are quite evenly distributed in the overall population, but also across all geographical regions. Moreover, comparing the distribution of the five personality traits, we found just few small differences between the eight geographical divisions that we used for our analysis. These results suggest that the regional national psychological/personality profile of Romania is quite homogenous. Directions for harnessing the potential of both personality profiles are presented to the reader. Other implications based on the bipolar and fractal structure of the personality profile are discussed from an interdisciplinary perspective.

On depth profiling of hydrogen and helium isotopes and its application to ion-implantation studies

International Nuclear Information System (INIS)

Boettiger, J.

1979-01-01

The thesis is divided into two parts, the first being a general review of the experimental methods for depth profiling of light isotopes, where ion beams are used. In the second part, studies of ion implantation of hydrogen and helium isotopes, applying the techniques discussed in the first part, are described. The paper summarizes recent experimental results and discusses recent developments. (Auth.)

Depth-kymography of vocal fold vibrations : part II. Simulations and direct comparisons with 3D profile measurements

NARCIS (Netherlands)

de Mul, Frits F. M.; George, Nibu A.; Qiu, Qingjun; Rakhorst, Gerhard; Schutte, Harm K.

2009-01-01

We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is

The effect of particle properties on the depth profile of buoyant plastics in the ocean

Science.gov (United States)

Kooi, Merel; Reisser, Julia; Slat, Boyan; Ferrari, Francesco F.; Schmid, Moritz S.; Cunsolo, Serena; Brambini, Roberto; Noble, Kimberly; Sirks, Lys-Anne; Linders, Theo E. W.; Schoeneich-Argent, Rosanna I.; Koelmans, Albert A.

2016-10-01

Most studies on buoyant microplastics in the marine environment rely on sea surface sampling. Consequently, microplastic amounts can be underestimated, as turbulence leads to vertical mixing. Models that correct for vertical mixing are based on limited data. In this study we report measurements of the depth profile of buoyant microplastics in the North Atlantic subtropical gyre, from 0 to 5 m depth. Microplastics were separated into size classes (0.5-1.5 and 1.5-5.0 mm) and types (‘fragments’ and ‘lines’), and associated with a sea state. Microplastic concentrations decreased exponentially with depth, with both sea state and particle properties affecting the steepness of the decrease. Concentrations approached zero within 5 m depth, indicating that most buoyant microplastics are present on or near the surface. Plastic rise velocities were also measured, and were found to differ significantly for different sizes and shapes. Our results suggest that (1) surface samplers such as manta trawls underestimate total buoyant microplastic amounts by a factor of 1.04-30.0 and (2) estimations of depth-integrated buoyant plastic concentrations should be done across different particle sizes and types. Our findings can assist with improving buoyant ocean plastic vertical mixing models, mass balance exercises, impact assessments and mitigation strategies.

An angle-resolved, wavelength-dispersive x-ray fluorescence spectrometer for depth profile analysis of ion-implanted semiconductors using synchrotron radiation

Science.gov (United States)

Schmitt, W.; Hormes, J.; Kuetgens, U.; Gries, W. H.

1992-01-01

An apparatus for angle-resolved, wavelength-dispersive x-ray fluorescence spectroscopy with synchrotron radiation has been built and tested at the beam line BN2 of the Bonn electron stretcher and accelerator (ELSA). The apparatus is to be used for nondestructive depth profile analysis of ion-implanted semiconductors as part of the multinational Versailles Project of Advanced Materials and Standards (VAMAS) project on ion-implanted reference materials. In particular, the centroid depths of depth profiles of various implants is to be determined by use of the angle-resolved signal ratio technique. First results of measurements on implants of phosphorus (100 keV, 1016 cm-2) and sulfur (200 keV, 1014 cm-2) in silicon wafers using ``white'' synchrotron radiation are presented and suggest that it should be generally possible to measure the centroid depth of an implant at dose densities as low as 1014 cm-2. Some of the apparative and technical requirements are discussed which are peculiar to the use of synchrotron radiation in general and to the use of nonmonochromatized radiation in particular.

An angle-resolved, wavelength-dispersive x-ray fluorescence spectrometer for depth profile analysis of ion-implanted semiconductors using synchrotron radiation

International Nuclear Information System (INIS)

Schmitt, W.; Hormes, J.; Kuetgens, U.; Gries, W.H.

1992-01-01

An apparatus for angle-resolved, wavelength-dispersive x-ray fluorescence spectroscopy with synchrotron radiation has been built and tested at the beam line BN2 of the Bonn electron stretcher and accelerator (ELSA). The apparatus is to be used for nondestructive depth profile analysis of ion-implanted semiconductors as part of the multinational Versailles Project of Advanced Materials and Standards (VAMAS) project on ion-implanted reference materials. In particular, the centroid depths of depth profiles of various implants is to be determined by use of the angle-resolved signal ratio technique. First results of measurements on implants of phosphorus (100 keV, 10 16 cm -2 ) and sulfur (200 keV, 10 14 cm -2 ) in silicon wafers using ''white'' synchrotron radiation are presented and suggest that it should be generally possible to measure the centroid depth of an implant at dose densities as low as 10 14 cm -2 . Some of the apparative and technical requirements are discussed which are peculiar to the use of synchrotron radiation in general and to the use of nonmonochromatized radiation in particular

Roughness development in the depth profiling with 500 eV O2+ beam with the combination of oxygen flooding and sample rotation

International Nuclear Information System (INIS)

Gui, D.; Xing, Z.X.; Huang, Y.H.; Mo, Z.Q.; Hua, Y.N.; Zhao, S.P.; Cha, L.Z.

2008-01-01

Roughness development is one of the most often addressed issues in the secondary ion mass spectrometry (SIMS) ultra-shallow depth profiling. The effect of oxygen flooding pressure on the roughness development has been investigated under the bombardment of 500 eV O 2 + beam with simultaneous sample rotation. Oxygen flooding had two competing effects on the surface roughening, i.e., enhancement of initiating roughening and suppression of roughening development, which were suggested to be described by the onset depth z on and transient width w tr of surface roughening. Both z on and w tr decreased as oxygen flooding pressure increased. As the result, surface roughening was most pronounced at the intermediate pressure from 4.4E-5 Pa to 5.8E-5 Pa. The surface roughening is negligible while without flooding or with flooding at the saturated pressure. No flooding is preferable for depth profiling ultra-shallow B implantation because of the better B profile shape and short analysis time

Objective characterization of bruise evolution using photothermal depth profiling and Monte Carlo modeling

Science.gov (United States)

Vidovič, Luka; Milanič, Matija; Majaron, Boris

2015-01-01

Pulsed photothermal radiometry (PPTR) allows noninvasive determination of laser-induced temperature depth profiles in optically scattering layered structures. The obtained profiles provide information on spatial distribution of selected chromophores such as melanin and hemoglobin in human skin. We apply the described approach to study time evolution of incidental bruises (hematomas) in human subjects. By combining numerical simulations of laser energy deposition in bruised skin with objective fitting of the predicted and measured PPTR signals, we can quantitatively characterize the key processes involved in bruise evolution (i.e., hemoglobin mass diffusion and biochemical decomposition). Simultaneous analysis of PPTR signals obtained at various times post injury provides an insight into the variations of these parameters during the bruise healing process. The presented methodology and results advance our understanding of the bruise evolution and represent an important step toward development of an objective technique for age determination of traumatic bruises in forensic medicine.

Improvement of Depth Profiling into Biotissues Using Micro Electrical Impedance Spectroscopy on a Needle with Selective Passivation.

Science.gov (United States)

Yun, Joho; Kim, Hyeon Woo; Lee, Jong-Hyun

2016-12-21

A micro electrical impedance spectroscopy (EIS)-on-a-needle for depth profiling (μEoN-DP) with a selective passivation layer (SPL) on a hypodermic needle was recently fabricated to measure the electrical impedance of biotissues along with the penetration depths. The SPL of the μEoN-DP enabled the sensing interdigitated electrodes (IDEs) to contribute predominantly to the measurement by reducing the relative influence of the connection lines on the sensor output. The discrimination capability of the μEoN-DP was verified using phosphate-buffered saline (PBS) at various concentration levels. The resistance and capacitance extracted through curve fitting were similar to those theoretically estimated based on the mixing ratio of PBS and deionized water; the maximum discrepancies were 8.02% and 1.85%, respectively. Depth profiling was conducted using four-layered porcine tissue to verify the effectiveness of the discrimination capability of the μEoN-DP. The magnitude and phase between dissimilar porcine tissues (fat and muscle) were clearly discriminated at the optimal frequency of 1 MHz. Two kinds of simulations, one with SPL and the other with complete passivation layer (CPL), were performed, and it was verified that the SPL was advantageous over CPL in the discrimination of biotissues in terms of sensor output.

Improvement of Depth Profiling into Biotissues Using Micro Electrical Impedance Spectroscopy on a Needle with Selective Passivation

Directory of Open Access Journals (Sweden)

Joho Yun

2016-12-01

Full Text Available A micro electrical impedance spectroscopy (EIS-on-a-needle for depth profiling (μEoN-DP with a selective passivation layer (SPL on a hypodermic needle was recently fabricated to measure the electrical impedance of biotissues along with the penetration depths. The SPL of the μEoN-DP enabled the sensing interdigitated electrodes (IDEs to contribute predominantly to the measurement by reducing the relative influence of the connection lines on the sensor output. The discrimination capability of the μEoN-DP was verified using phosphate-buffered saline (PBS at various concentration levels. The resistance and capacitance extracted through curve fitting were similar to those theoretically estimated based on the mixing ratio of PBS and deionized water; the maximum discrepancies were 8.02% and 1.85%, respectively. Depth profiling was conducted using four-layered porcine tissue to verify the effectiveness of the discrimination capability of the μEoN-DP. The magnitude and phase between dissimilar porcine tissues (fat and muscle were clearly discriminated at the optimal frequency of 1 MHz. Two kinds of simulations, one with SPL and the other with complete passivation layer (CPL, were performed, and it was verified that the SPL was advantageous over CPL in the discrimination of biotissues in terms of sensor output.

What Can Radiocarbon Depth Profiles Tell Us About The LGM Circulation?

Science.gov (United States)

Burke, A.; Stewart, A.; Adkins, J. F.; Ferrari, R. M.; Thompson, A. F.; Jansen, M. F.

2014-12-01

Published reconstructions of radiocarbon in the Atlantic sector of the Southern Ocean indicate that there is a mid-depth maximum in radiocarbon age during the last glacial maximum (LGM). This is in contrast to the modern ocean where intense mixing between water masses along shared density surfaces (isopycnals) results in a relatively homogenous radiocarbon profile. A recent study (Ferrari et al. 2014) suggested that the extended Antarctic sea ice cover during the LGM necessitated a shallower boundary between the upper and lower branches of the meridional overturning circulation (MOC). This shoaled boundary lay above major topographic features and their associated strong diapycnal mixing, which isolated dense southern-sourced water in the lower branch of the overturning circulation. This isolation would have allowed radiocarbon to decay, and thus provides a possible explanation for the mid-depth radiocarbon age bulge. We test this hypothesis using an idealized, 2D, residual-mean dynamical model of the global overturning circulation. Concentration distributions of a decaying tracer that is advected by the simulated overturning are compared to published radiocarbon data. We test the sensitivity of the mid-depth radiocarbon age to changes in sea ice extent, wind strength, and isopycnal and diapycnal diffusion. The mid-depth radiocarbon age bulge is most likely caused by the different circulation geometry, associated with increased sea ice extent. In particular, with an LGM-like sea ice extent the upper and lower branches of the MOC no longer share isopycnals, so radiocarbon-rich northern-sourced water is no longer mixed rapidly into the southern-sourced water. However, this process alone cannot explain the magnitude of the glacial radiocarbon anomalies; additional isolation (e.g. from reduced air-sea gas exchange associated with the increased sea ice) is required. Ferrari, R., M. F. Jansen, J. F. Adkins, A. Burke, A. L. Stewart, and A. F. Thompson (2014), Antarctic sea

Analysis of the Tikhonov regularization to retrieve thermal conductivity depth-profiles from infrared thermography data

Science.gov (United States)

Apiñaniz, Estibaliz; Mendioroz, Arantza; Salazar, Agustín; Celorrio, Ricardo

2010-09-01

We analyze the ability of the Tikhonov regularization to retrieve different shapes of in-depth thermal conductivity profiles, usually encountered in hardened materials, from surface temperature data. Exponential, oscillating, and sigmoidal profiles are studied. By performing theoretical experiments with added white noises, the influence of the order of the Tikhonov functional and of the parameters that need to be tuned to carry out the inversion are investigated. The analysis shows that the Tikhonov regularization is very well suited to reconstruct smooth profiles but fails when the conductivity exhibits steep slopes. We check a natural alternative regularization, the total variation functional, which gives much better results for sigmoidal profiles. Accordingly, a strategy to deal with real data is proposed in which we introduce this total variation regularization. This regularization is applied to the inversion of real data corresponding to a case hardened AISI1018 steel plate, giving much better anticorrelation of the retrieved conductivity with microindentation test data than the Tikhonov regularization. The results suggest that this is a promising way to improve the reliability of local inversion methods.

Combined evaluation of grazing incidence X-ray fluorescence and X-ray reflectivity data for improved profiling of ultra-shallow depth distributions

Energy Technology Data Exchange (ETDEWEB)

Ingerle, D., E-mail: dingerle@ati.ac.at [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria); Meirer, F. [Inorganic Chemistry and Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Universiteitsweg 99, 3584 CG Utrecht (Netherlands); Pepponi, G.; Demenev, E.; Giubertoni, D. [MiNALab, CMM-irst, Fondazione Bruno Kessler, Via Sommarive 18, I-38050 Povo (Italy); Wobrauschek, P.; Streli, C. [Atominstitut, Vienna University of Technology, Stadionallee 2, A-1020 Vienna (Austria)

2014-09-01

The continuous downscaling of the process size for semiconductor devices pushes the junction depths and consequentially the implantation depths to the top few nanometers of the Si substrate. This motivates the need for sensitive methods capable of analyzing dopant distribution, total dose and possible impurities. X-ray techniques utilizing the external reflection of X-rays are very surface sensitive, hence providing a non-destructive tool for process analysis and control. X-ray reflectometry (XRR) is an established technique for the characterization of single- and multi-layered thin film structures with layer thicknesses in the nanometer range. XRR spectra are acquired by varying the incident angle in the grazing incidence regime while measuring the specular reflected X-ray beam. The shape of the resulting angle-dependent curve is correlated to changes of the electron density in the sample, but does not provide direct information on the presence or distribution of chemical elements in the sample. Grazing Incidence XRF (GIXRF) measures the X-ray fluorescence induced by an X-ray beam incident under grazing angles. The resulting angle dependent intensity curves are correlated to the depth distribution and mass density of the elements in the sample. GIXRF provides information on contaminations, total implanted dose and to some extent on the depth of the dopant distribution, but is ambiguous with regard to the exact distribution function. Both techniques use similar measurement procedures and data evaluation strategies, i.e. optimization of a sample model by fitting measured and calculated angle curves. Moreover, the applied sample models can be derived from the same physical properties, like atomic scattering/form factors and elemental concentrations; a simultaneous analysis is therefore a straightforward approach. This combined analysis in turn reduces the uncertainties of the individual techniques, allowing a determination of dose and depth profile of the implanted

Deuterium Depth Profile in Neutron-Irradiated Tungsten Exposed to Plasma

International Nuclear Information System (INIS)

Shimada, Masashi; Cao, G.; Hatano, Y.; Oda, T.; Oya, Y.; Hara, M.; Calderoni, P.

2011-01-01

The effect of radiation damage has been mainly simulated using high-energy ion bombardment. The ions, however, are limited in range to only a few microns into the surface. Hence, some uncertainty remains about the increase of trapping at radiation damage produced by 14 MeV fusion neutrons, which penetrate much farther into the bulk material. With the Japan-US joint research project: Tritium, Irradiations, and Thermofluids for America and Nippon (TITAN), the tungsten samples (99.99 % pure from A.L.M.T., 6mm in diameter, 0.2mm in thickness) were irradiated to high flux neutrons at 50 C and to 0.025 dpa in the High Flux Isotope Reactor (HFIR) at the Oak Ridge National Laboratory (ORNL). Subsequently, the neutron-irradiated tungsten samples were exposed to a high-flux deuterium plasma (ion flux: 1021-1022 m-2s-1, ion fluence: 1025-1026 m-2) in the Tritium Plasma Experiment (TPE) at the Idaho National Laboratory (INL). First results of deuterium retention in neutron-irradiated tungsten exposed in TPE have been reported previously. This paper presents the latest results in our on-going work of deuterium depth profiling in neutron-irradiated tungsten via nuclear reaction analysis. The experimental data is compared with the result from non neutron-irradiated tungsten, and is analyzed with the Tritium Migration Analysis Program (TMAP) to elucidate the hydrogen isotope behavior such as retention and depth distribution in neutron-irradiated and non neutron-irradiated tungsten.

Possibilities of LA-ICP-MS technique for the spatial elemental analysis of the recent fish scales: Line scan vs. depth profiling

International Nuclear Information System (INIS)

Hola, Marketa; Kalvoda, Jiri; Novakova, Hana; Skoda, Radek; Kanicky, Viktor

2011-01-01

LA-ICP-MS and solution based ICP-MS in combination with electron microprobe are presented as a method for the determination of the elemental spatial distribution in fish scales which represent an example of a heterogeneous layered bone structure. Two different LA-ICP-MS techniques were tested on recent common carp (Cyprinus carpio) scales: (a)A line scan through the whole fish scale perpendicular to the growth rings. The ablation crater of 55 μm width and 50 μm depth allowed analysis of the elemental distribution in the external layer. Suitable ablation conditions providing a deeper ablation crater gave average values from the external HAP layer and the collagen basal plate. (b)Depth profiling using spot analysis was tested in fish scales for the first time. Spot analysis allows information to be obtained about the depth profile of the elements at the selected position on the sample. The combination of all mentioned laser ablation techniques provides complete information about the elemental distribution in the fish scale samples. The results were compared with the solution based ICP-MS and EMP analyses. The fact that the results of depth profiling are in a good agreement both with EMP and PIXE results and, with the assumed ways of incorporation of the studied elements in the HAP structure, suggests a very good potential for this method.

Possibilities of LA-ICP-MS technique for the spatial elemental analysis of the recent fish scales: Line scan vs. depth profiling

Energy Technology Data Exchange (ETDEWEB)

Hola, Marketa [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic); Kalvoda, Jiri, E-mail: jkalvoda@centrum.cz [Department of Geological Sciences, Masaryk University of Brno, Kotlarska 2, 611 37 Brno (Czech Republic); Novakova, Hana [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic); Skoda, Radek [Department of Geological Sciences, Masaryk University of Brno, Kotlarska 2, 611 37 Brno (Czech Republic); Kanicky, Viktor [Department of Chemistry, Masaryk University of Brno, Kamenice 5, 625 00 Brno (Czech Republic)

2011-01-01

LA-ICP-MS and solution based ICP-MS in combination with electron microprobe are presented as a method for the determination of the elemental spatial distribution in fish scales which represent an example of a heterogeneous layered bone structure. Two different LA-ICP-MS techniques were tested on recent common carp (Cyprinus carpio) scales: (a)A line scan through the whole fish scale perpendicular to the growth rings. The ablation crater of 55 {mu}m width and 50 {mu}m depth allowed analysis of the elemental distribution in the external layer. Suitable ablation conditions providing a deeper ablation crater gave average values from the external HAP layer and the collagen basal plate. (b)Depth profiling using spot analysis was tested in fish scales for the first time. Spot analysis allows information to be obtained about the depth profile of the elements at the selected position on the sample. The combination of all mentioned laser ablation techniques provides complete information about the elemental distribution in the fish scale samples. The results were compared with the solution based ICP-MS and EMP analyses. The fact that the results of depth profiling are in a good agreement both with EMP and PIXE results and, with the assumed ways of incorporation of the studied elements in the HAP structure, suggests a very good potential for this method.

A Study of Storage Ring Requirements for an Explosive Detection System Using NRA Method

CERN Document Server

Wang, Tai-Sen

2005-01-01

The technical feasibility of an explosives detection system based on the nuclear resonance absorption (NRA) of gamma rays in nitrogen-rich materials was demonstrated at Los Alamos National Laboratory (LANL) in 1993 by using an RFQ proton accelerator and a tomographic imaging prototype.* The study is being continued recently to examine deployment of such an active interrogation system in realistic scenarios. The approach is to use a cyclotron and electron-cooling-equipped storage rings(s) to provide the high quality and high current proton beam needed in a practical application. In this work, we investigate the storage ring requirements for a variant of the airport luggage inspection system considered in the earlier LANL experiments. Estimations are carried out based on the required inspection throughput, the gamma ray yield, the proton beam emittance growth due to scattering with the photon-production target, beam current limit in the storage ring, and the electron cooling rate. Studies using scaling and reas...

Depth profiling of Al{sub 2}O{sub 3} + TiO{sub 2} nanolaminates by means of a time-of-flight energy spectrometer

Energy Technology Data Exchange (ETDEWEB)

Laitinen, M., E-mail: mikko.i.laitinen@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Sajavaara, T., E-mail: timo.sajavaara@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Rossi, M., E-mail: mikko.rossi@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Julin, J., E-mail: jaakko.julin@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland); Puurunen, R.L., E-mail: riikka.puurunen@vtt.fi [VTT Technical Research Centre of Finland, Tietotie 3, FI-02150 Espoo (Finland); Suni, T., E-mail: tommi.suni@vtt.fi [VTT Technical Research Centre of Finland, Tietotie 3, FI-02150 Espoo (Finland); Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Ishida, T., E-mail: tadashii@iis.u-tokyo.ac.jp [Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Fujita, H., E-mail: fujita@iis.u-tokyo.ac.jp [Institute of Industrial Science, University of Tokyo, ew304, 4-6-1 Komaba, Meguro-ku, 153-8505 Tokyo (Japan); Arstila, K., E-mail: kai.arstila@imec.be [Imec, Kapeldreef 75, Leuven 3001 (Belgium); Brijs, B., E-mail: bert.brijs@imec.be [Imec, Kapeldreef 75, Leuven 3001 (Belgium); Whitlow, H.J., E-mail: harry.j.whitlow@jyu.fi [Dept. of Physics, P.O. Box 35, 40014 University of Jyvaeskylae (Finland)

2011-12-15

Atomic layer deposition (ALD) is currently a widespread method to grow conformal thin films with a sub-nm thickness control. By using ALD for nanolaminate oxides, it is possible to fine tune the electrical, optical and mechanical properties of thin films. In this study the elemental depth profiles and surface roughnesses were determined for Al{sub 2}O{sub 3} + TiO{sub 2} nanolaminates with nominal single-layer thicknesses of 1, 2, 5, 10 and 20 nm and total thickness between 40 nm and 60 nm. The depth profiles were measured by means of a time-of-flight elastic recoil detection analysis (ToF-ERDA) spectrometer recently installed at the University of Jyvaeskylae. In TOF-E measurements {sup 63}Cu, {sup 35}Cl, {sup 12}C and {sup 4}He ions with energies ranging from 0.5 to 10 MeV, were used and depth profiles of the whole nanolaminate film could be analyzed down to 5 nm individual layer thickness.

Investigation of the compositional depth profile in epitaxial submicrometer layers of AIIIBV heterostructures

International Nuclear Information System (INIS)

Baumbach, T.; Bruehl, H.G.; Rhan, H.; Pietsch, U.

1988-01-01

The compositional depth profile in semiconductor heterostructures can be determined from X-ray diffraction patterns. Different grading profiles were studied through theoretical simulations with regard to their features in the rocking curve. It was found that the thickness and the grading of a particular layer cannot be determined independently of each other. A linear grading gives rise to an increased peak width of the layer diffraction peak whereas an exponential grading can be detected from the damping of high-order interference fringes. The exponential model can be applied to determine the abruptness of the heterointerfaces. The proposed evaluation method of experimental rocking curves includes the case of overlapping peaks of the layer and the substrate diffraction. The simulation results are discussed for a GaAs/Ga 1-x Al x As/GaAs[100] double heterostructure. When the experimental resolution is taken into account, the sensitivity of the interface width determination was 100-200 A. (orig.)

Understanding of CO{sub 2} interaction with thermally grown SiO{sub 2} on Si using IBA depth profiling techniques

Energy Technology Data Exchange (ETDEWEB)

Deokar, Geetanjali; D’Angelo, Marie; Briand, Emrick [INSP, UPMC, CNRS UMR 7588, 4 Place Jussieu, Paris F-75005 (France); Deville Cavellin, Catherine, E-mail: deville@univ-paris12.fr [INSP, UPMC, CNRS UMR 7588, 4 Place Jussieu, Paris F-75005 (France); Faculté des Sciences et Technologie UPEC, 61 Av., De Gaulle, Créteil F-94010 (France)

2013-06-01

Interactions between CO{sub 2} and SiO{sub 2} films thermally grown on Si have been studied using {sup 18}O and {sup 13}C as isotopic tracers associated with ion beam analysis (IBA) depth profiling techniques. From secondary ion mass spectrometry (SIMS) measurements no carbon from CO{sub 2} is detected in the silica while it is found in Si. These results suggest that CO{sub 2} diffuses through the silica. Exchanges of oxygen between CO{sub 2} and silica can be observed from {sup 18}O to {sup 16}O SIMS signals variation. The oxygen concentration depth profiles were determined quantitatively using the narrow resonance near 151 keV in the {sup 18}O(p,α){sup 15}N nuclear reaction (Narrow Resonance Profiling, NRP). We demonstrate that two distinct oxygen exchanges processes co-exist and we determine the diffusion coefficient of the CO{sub 2} molecule in the silica at 1100 °C.

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Energy Technology Data Exchange (ETDEWEB)

Shard, A. G.; Havelund, Rasmus; Spencer, Steve J.; Gilmore, I. S.; Alexander, Morgan R.; Angerer, Tina B.; Aoyagi, Satoka; Barnes, Jean P.; Benayad, Anass; Bernasik, Andrzej; Ceccone, Giacomo; Counsell, Jonathan D.; Deeks, Christopher; Fletcher, John S.; Graham, Daniel J.; Heuser, Christian; Lee, Tae G.; Marie, Camille; Marzec, Mateusz M.; Mishra, Gautam; Rading, Derk; Renault, Oliver; Scurr, David J.; Shon, Hyun K.; Spampinato, Valentina; Tian, Hua; Wang, Fuyi; Winograd, Nicholas; Wu, Kui; Wucher, Andreas; Zhou, Yufan; Zhu, Zihua

2015-07-23

We report the results of a VAMAS (Versailles Project on Advanced Materials and Standards) interlaboratory study on the measurement of composition in organic depth profiling. Layered samples with known binary compositions of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro-L-phenylalanine in each layer were manufactured in a single batch and distributed to more than 20 participating laboratories. The samples were analyzed using argon cluster ion sputtering and either X-ray Photoelectron Spectroscopy (XPS) or Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to generate depth profiles. Participants were asked to estimate the volume fractions in two of the layers and were provided with the compositions of all other layers. Participants using XPS provided volume fractions within 0.03 of the nominal values. Participants using ToF-SIMS either made no attempt, or used various methods that gave results ranging in error from 0.02 to over 0.10 in volume fraction, the latter representing a 50% relative error for a nominal volume fraction of 0.2. Error was predominantly caused by inadequacy in the ability to compensate for primary ion intensity variations and the matrix effect in SIMS. Matrix effects in these materials appear to be more pronounced as the number of atoms in both the primary analytical ion and the secondary ion increase. Using the participants’ data we show that organic SIMS matrix effects can be measured and are remarkably consistent between instruments. We provide recommendations for identifying and compensating for matrix effects. Finally we demonstrate, using a simple normalization method, that virtually all ToF-SIMS participants could have obtained estimates of volume fraction that were at least as accurate and consistent as XPS.

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across American Samoa in 2015

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Hydrogen-Induced Plastic Deformation in ZnO

Science.gov (United States)

Lukáč, F.; Čížek, J.; Vlček, M.; Procházka, I.; Anwand, W.; Brauer, G.; Traeger, F.; Rogalla, D.; Becker, H.-W.

In the present work hydrothermally grown ZnO single crystals covered with Pd over-layer were electrochemically loaded with hydrogen and the influence of hydrogen on ZnO micro structure was investigated by positron annihilation spectroscopy (PAS). Nuclear reaction analysis (NRA) was employed for determination of depth profile of hydrogen concentration in the sample. NRA measurements confirmed that a substantial amount of hydrogen was introduced into ZnO by electrochemical charging. The bulk hydrogen concentration in ZnO determined by NRA agrees well with the concentration estimated from the transported charge using the Faraday's law. Moreover, a subsurface region with enhanced hydrogen concentration was found in the loaded crystals. Slow positron implantation spectroscopy (SPIS) investigations of hydrogen-loaded crystal revealed enhanced concentration of defects in the subsurface region. This testifies hydrogen-induced plastic deformation of the loaded crystal. Absorbed hydrogen causes a significant lattice expansion. At low hydrogen concentrations this expansion is accommodated by elastic straining, but at higher concentrations hydrogen-induced stress exceeds the yield stress in ZnO and plastic deformation of the loaded crystal takes place. Enhanced hydrogen concentration detected in the subsurface region by NRA is, therefore, due to excess hydrogen trapped at open volume defects introduced by plastic deformation. Moreover, it was found that hydrogen-induced plastic deformation in the subsurface layer leads to typical surface modification: formation of hexagonal shape pyramids on the surface due to hydrogen-induced slip in the [0001] direction.

Stable carbon isotope depth profiles and soil organic carbon dynamics in the lower Mississippi Basin

Science.gov (United States)

Wynn, J.G.; Harden, J.W.; Fries, T.L.

2006-01-01

Analysis of depth trends of 13C abundance in soil organic matter and of 13C abundance from soil-respired CO2 provides useful indications of the dynamics of the terrestrial carbon cycle and of paleoecological change. We measured depth trends of 13C abundance from cropland and control pairs of soils in the lower Mississippi Basin, as well as the 13C abundance of soil-respired CO2 produced during approximately 1-year soil incubation, to determine the role of several candidate processes on the 13C depth profile of soil organic matter. Depth profiles of 13C from uncultivated control soils show a strong relationship between the natural logarithm of soil organic carbon concentration and its isotopic composition, consistent with a model Rayleigh distillation of 13C in decomposing soil due to kinetic fractionation during decomposition. Laboratory incubations showed that initially respired CO 2 had a relatively constant 13C content, despite large differences in the 13C content of bulk soil organic matter. Initially respired CO2 was consistently 13C-depleted with respect to bulk soil and became increasingly 13C-depleted during 1-year, consistent with the hypothesis of accumulation of 13C in the products of microbial decomposition, but showing increasing decomposition of 13C-depleted stable organic components during decomposition without input of fresh biomass. We use the difference between 13C / 12C ratios (calculated as ??-values) between respired CO 2 and bulk soil organic carbon as an index of the degree of decomposition of soil, showing trends which are consistent with trends of 14C activity, and with results of a two-pooled kinetic decomposition rate model describing CO2 production data recorded during 1 year of incubation. We also observed inconsistencies with the Rayleigh distillation model in paired cropland soils and reasons for these inconsistencies are discussed. ?? 2005 Elsevier B.V. All rights reserved.

Present and future role of ion beam analysis in the study of cultural heritage materials: The example of the AGLAE facility

International Nuclear Information System (INIS)

Salomon, J.; Dran, J.-C.; Guillou, T.; Moignard, B.; Pichon, L.; Walter, P.; Mathis, F.

2008-01-01

The application of IBA to cultural heritage mostly relies on the use of PIXE because of its high sensitivity and its ease of implementation at atmospheric pressure. The need for depth information not easily available with this technique has conducted to associate RBS also in external beam mode. We have progressively developed a set-up that permits such a combination of techniques either simultaneously or sequentially. The set-up is currently further improved to permit NRA measurement (depth profiles of light elements) in addition to PIXE and RBS. The coupling of all these techniques provides a wealth of information on cultural heritage objects, not easily attainable with any other single method

Electron beam and optical depth profiling of quasibulk GaN

International Nuclear Information System (INIS)

Chernyak, L.; Osinsky, A.; Nootz, G.; Schulte, A.; Jasinski, J.; Benamara, M.; Liliental-Weber, Z.; Look, D. C.; Molnar, R. J.

2000-01-01

Electron beam and optical depth profiling of thick (5.5--64 μm) quasibulk n-type GaN samples, grown by hydride vapor-phase epitaxy, were carried out using electron beam induced current (EBIC), microphotoluminescence (PL), and transmission electron microscopy (TEM). The minority carrier diffusion length, L, was found to increase linearly from 0.25 μm, at a distance of about 5 μm from the GaN/sapphire interface, to 0.63 μm at the GaN surface, for a 36-μm-thick sample. The increase in L was accompanied by a corresponding increase in PL band-to-band radiative transition intensity as a function of distance from the GaN/sapphire interface. We attribute the latter changes in PL intensity and minority carrier diffusion length to a reduced carrier mobility and lifetime at the interface, due to scattering at threading dislocations. The results of EBIC and PL measurements are in good agreement with the values for dislocation density obtained using TEM

SIMS depth profiling of rubber-tyre cord bonding layers prepared using 64Zn depleted ZnO

International Nuclear Information System (INIS)

Fulton, W.S.; Sykes, D.E.; Smith, G.C.

2006-01-01

Zinc oxide and copper/zinc sulphide layers are formed during vulcanisation and moulding of rubber to brass-coated steel tyre reinforcing cords. Previous studies have described how zinc diffuses through the rubber-brass interface to form zinc sulphide, and combines with oxygen to create zinc oxide during dezincification. The zinc is usually assumed to originate in the brass of the tyre cord, however, zinc oxide is also present in the rubber formulation. We reveal how zinc from these sources is distributed within the interfacial bonding layers, before and after heat and humidity ageing. Zinc oxide produced using 64 Zn-isotope depleted zinc was mixed in the rubber formulation in place of the natural ZnO and the zinc isotope ratios within the interfacial layers were followed by secondary ion mass spectroscopy (SIMS) depth profiling. Variations in the relative ratios of the zinc isotopes during depth profiling were measured for unaged, heat-aged and humidity-aged wire samples and in each case a relatively large proportion of the zinc incorporated into the interfacial layer as zinc sulphide was shown to have originated from ZnO in the rubber compound

Depth profiling Li in electrode materials of lithium ion battery by {sup 7}Li(p,γ){sup 8}Be and {sup 7}Li(p,α){sup 4}He nuclear reactions

Energy Technology Data Exchange (ETDEWEB)

Sunitha, Y., E-mail: sunibarc@gmail.com; Kumar, Sanjiv

2017-06-01

A proton induced γ-ray emission method based on {sup 7}Li(p,γ){sup 8}Be proton capture reaction and a nuclear reaction analysis method involving {sup 7}Li(p,α){sup 4}He reaction are described for depth profiling Li in the electrode materials, graphite and lithium cobalt oxide for example, of a Li-ion battery. Depth profiling by {sup 7}Li(p,γ){sup 8}Be reaction is accomplished by the resonance at 441 keV and involves the measurement of 14.6 and 17.6 MeV γ-rays, characteristic of the reaction, by a NaI(Tl) detector. The method has a detection sensitivity of ∼0.2 at% and enables profiling up to a depth ≥20 µm with a resolution of ≥150 nm. The profiling to a fairly large depth is facilitated by the absence of any other resonance up to 1800 keV proton energy. The reaction has substantial off-resonance cross-sections. A procedure is outlined for evaluating the off-resonance yields. Interferences from fluorine and aluminium are major limitation of this depth profiling methodology. The depth profile measurement by {sup 7}Li(p,α){sup 4}He reaction, on the other hand, utilises 2–3 MeV protons and entails the detection of α-particles at 90° or 150° angles. The reaction exhibits inverse kinematics at 150°. This method, too, suffers interference from fluorine due to the simultaneous occurrence of {sup 19}F(p,α){sup 16}O reaction. Kinematical considerations show that the interference is minimal at 90° and thus is the recommended angle of detection. The method is endowed with a detection sensitivity of ∼0.1 at%, a depth resolution of ∼100 nm and a probing depth of about 30 µm in the absence and 5–8 µm in the presence of fluorine in the material. Both methods yielded comparable depth profiles of Li in the cathode (lithium cobalt oxide) and the anode (graphite) of a Li-ion battery.

Condition and biochemical profile of blue mussels (Mytilus edulis L.) cultured at different depths in a cold water coastal environment

Science.gov (United States)

Gallardi, Daria; Mills, Terry; Donnet, Sebastien; Parrish, Christopher C.; Murray, Harry M.

2017-08-01

The growth and health of cultured blue mussels (Mytilus edulis) are affected by environmental conditions. Typically, culture sites are situated in sheltered areas near shore (i.e., 20 m depth) mussel culture has been growing. This study evaluated the effect of culture depth on blue mussels in a cold water coastal environment (Newfoundland, Canada). Culture depth was examined over two years from September 2012 to September 2014; mussels from three shallow water (5 m) and three deep water (15 m) sites were compared for growth and biochemical composition; culture depths were compared for temperature and chlorophyll a. Differences between the two years examined were noted, possibly due to harsh winter conditions in the second year of the experiment. In both years shallow and deep water mussels presented similar condition; in year 2 deep water mussels had a significantly better biochemical profile. Lipid and glycogen analyses showed seasonal variations, but no significant differences between shallow and deep water were noted. Fatty acid profiles showed a significantly higher content of omega-3 s (20:5ω3; EPA) and lower content of bacterial fatty acids in deep water sites in year 2. Everything considered, deep water appeared to provide a more favorable environment for mussel growth than shallow water under harsher weather conditions.

Surface analysis and depth profiling of corrosion products formed in lead pipes used to supply low alkalinity drinking water.

Science.gov (United States)

Davidson, C M; Peters, N J; Britton, A; Brady, L; Gardiner, P H E; Lewis, B D

2004-01-01

Modern analytical techniques have been applied to investigate the nature of lead pipe corrosion products formed in pH adjusted, orthophosphate-treated, low alkalinity water, under supply conditions. Depth profiling and surface analysis have been carried out on pipe samples obtained from the water distribution system in Glasgow, Scotland, UK. X-ray diffraction spectrometry identified basic lead carbonate, lead oxide and lead phosphate as the principal components. Scanning electron microscopy/energy-dispersive x-ray spectrometry revealed the crystalline structure within the corrosion product and also showed spatial correlations existed between calcium, iron, lead, oxygen and phosphorus. Elemental profiling, conducted by means of secondary ion mass spectrometry (SIMS) and secondary neutrals mass spectrometry (SNMS) indicated that the corrosion product was not uniform with depth. However, no clear stratification was apparent. Indeed, counts obtained for carbonate, phosphate and oxide were well correlated within the depth range probed by SIMS. SNMS showed relationships existed between carbon, calcium, iron, and phosphorus within the bulk of the scale, as well as at the surface. SIMS imaging confirmed the relationship between calcium and lead and suggested there might also be an association between chloride and phosphorus.

SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions

Science.gov (United States)

Havelund, R.; Seah, M. P.; Tiddia, M.; Gilmore, I. S.

2018-02-01

A procedure has been established to define the interface position in depth profiles accurately when using secondary ion mass spectrometry and the negative secondary ions. The interface position varies strongly with the extent of the matrix effect and so depends on the secondary ion measured. Intensity profiles have been measured at both fluorenylmethyloxycarbonyl-uc(l)-pentafluorophenylalanine (FMOC) to Irganox 1010 and Irganox 1010 to FMOC interfaces for many secondary ions. These profiles show separations of the two interfaces that vary over some 10 nm depending on the secondary ion selected. The shapes of these profiles are strongly governed by matrix effects, slightly weakened by a long wavelength roughening. The matrix effects are separately measured using homogeneous, known mixtures of these two materials. Removal of the matrix and roughening effects give consistent compositional profiles for all ions that are described by an integrated exponentially modified Gaussian (EMG) profile. Use of a simple integrated Gaussian may lead to significant errors. The average interface positions in the compositional profiles are determined to standard uncertainties of 0.19 and 0.14 nm, respectively, using the integrated EMG function. Alternatively, and more simply, it is shown that interface positions and profiles may be deduced from data for several secondary ions with measured matrix factors by simply extrapolating the result to Ξ = 0. Care must be taken in quoting interface resolutions since those measured for predominantly Gaussian interfaces with Ξ above or below zero, without correction, appear significantly better than the true resolution.

Sub-nanometer resolution XPS depth profiling: Sensing of atoms

Energy Technology Data Exchange (ETDEWEB)

Szklarczyk, Marek, E-mail: szklarcz@chem.uw.edu.pl [Faculty of Chemistry, University of Warsaw, ul. Pasteura 1, 02-093 Warsaw (Poland); Shim-Pol, ul. Lubomirskiego 5, 05-080 Izabelin (Poland); Macak, Karol; Roberts, Adam J. [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom); Takahashi, Kazuhiro [Kratos XPS Section, Shimadzu Corp., 380-1 Horiyamashita, Hadano, Kanagawa 259-1304 (Japan); Hutton, Simon [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom); Głaszczka, Rafał [Shim-Pol, ul. Lubomirskiego 5, 05-080 Izabelin (Poland); Blomfield, Christopher [Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP (United Kingdom)

2017-07-31

Highlights: • Angle resolved photoelectron depth profiling of nano thin films. • Sensing atomic position in SAM films. • Detection of direction position of adsorbed molecules. - Abstract: The development of a method capable of distinguishing a single atom in a single molecule is important in many fields. The results reported herein demonstrate sub-nanometer resolution for angularly resolved X-ray photoelectron spectroscopy (ARXPS). This is made possible by the incorporation of a Maximum Entropy Method (MEM) model, which utilize density corrected electronic emission factors to the X-ray photoelectron spectroscopy (XPS) experimental results. In this paper we report on the comparison between experimental ARXPS results and reconstructed for both inorganic and organic thin film samples. Unexpected deviations between experimental data and calculated points are explained by the inaccuracy of the constants and standards used for the calculation, e.g. emission factors, scattering intensity and atomic density through the studied thickness. The positions of iron, nitrogen and fluorine atoms were determined in the molecules of the studied self-assembled monolayers. It has been shown that reconstruction of real spectroscopic data with 0.2 nm resolution is possible.

Non-destructive microstructural analysis with depth resolution

Energy Technology Data Exchange (ETDEWEB)

Zolotoyabko, E. E-mail: zloto@tx.technion.ac.il; Quintana, J.P

2003-01-01

A depth-sensitive X-ray diffraction technique has been developed with the aim of studying microstructural modifications in inhomogeneous polycrystalline materials. In that method, diffraction profiles are measured at different X-ray energies varied by small steps. X-rays at higher energies probe deeper layers of material. Depth-resolved structural information is retrieved by comparing energy-dependent diffraction profiles. The method provides non-destructive depth profiling of the preferred orientation, grain size, microstrain fluctuations and residual strains. This technique is applied to the characterization of seashells. Similarly, energy-variable X-ray diffraction can be used for the non-destructive characterization of different laminated structures and composite materials.

Depth-Profiling Electronic and Structural Properties of Cu(In,Ga)(S,Se)2 Thin-Film Solar Cell.

Science.gov (United States)

Chiang, Ching-Yu; Hsiao, Sheng-Wei; Wu, Pin-Jiun; Yang, Chu-Shou; Chen, Chia-Hao; Chou, Wu-Ching

2016-09-14

Utilizing a scanning photoelectron microscope (SPEM) and grazing-incidence X-ray powder diffraction (GIXRD), we studied the electronic band structure and the crystalline properties of the pentanary Cu(In,Ga)(S,Se)2 (CIGSSe) thin-film solar cell as a function of sample depth on measuring the thickness-gradient sample. A novel approach is proposed for studying the depth-dependent information on thin films, which can provide a gradient thickness and a wide cross-section of the sample by polishing process. The results exhibit that the CIGSSe absorber layer possesses four distinct stoichiometries. The growth mechanism of this distinctive compositional distribution formed by a two-stage process is described according to the thermodynamic reaction and the manufacturing process. On the basis of the depth-profiling results, the gradient profiles of the conduction and valence bands were constructed to elucidate the performance of the electrical properties (in this case, Voc = 620 mV, Jsc = 34.6 mA/cm(2), and η = 14.04%); the valence-band maxima (VBM) measured with a SPEM in the spectroscopic mode coincide with this band-structure model, except for a lowering of the VBM observed in the surface region of the absorber layer due to the ordered defect compound (ODC). In addition, the depth-dependent texturing X-ray diffraction pattern presents the crystalline quality and the residual stress for each depth of a thin-film device. We find that the randomly oriented grains in the bottom region of the absorber layer and the different residual stress between the underlying Mo and the absorber interface, which can deteriorate the electrical performance due to peeling-off effect. An anion interstitial defect can be observed on comparing the anion concentration of the elemental distribution with crystalline composition; a few excess sulfur atoms insert in interstitial sites at the front side of the absorber layer, whereas the interstitial selenium atoms insert at the back side.

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Mariana Archipelago in 2014

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago since 2013

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Creation of oxygen-enriched layers at the surface of GaAs single crystal

International Nuclear Information System (INIS)

Kulik, M.; Maczka, D.; Kobzev, A.P.

1999-01-01

The optical properties and the element depth profiles at the (100) plane high resistant and noncomposite GaAs single crystals implanted with In ions were investigated. The results have been compared with those obtained for virgin samples. The optic properties for all of the samples (implanted and not implanted, annealed and not annealed) have been measured using the ellipsometric method. The element depth profiles for the same samples have been obtained by the RBS and NRA techniques. It has been shown that the post-implantation annealing at a temperature more than 600 deg C leads to a ten time increase in contents of oxygen atoms in the implanted layer with respect to the not annealed sample. The thickness of the transparence layer at the surface of GaAs single crystal increases also after implantation with In ions and subsequent annealing

Depth profiling of marker layers using x-ray waveguide structures

International Nuclear Information System (INIS)

Gupta, Ajay; Rajput, Parasmani; Saraiya, Amit; Reddy, V. R.; Gupta, Mukul; Bernstorff, Sigrid; Amenitsch, H.

2005-01-01

It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/M/Si trilayer (M=Fe, W), forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone

Depth profiling of marker layers using x-ray waveguide structures

Science.gov (United States)

Gupta, Ajay; Rajput, Parasmani; Saraiya, Amit; Reddy, V. R.; Gupta, Mukul; Bernstorff, Sigrid; Amenitsch, H.

2005-08-01

It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/M/Si trilayer ( M=Fe , W), forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone.

Depth profiling of inks in authentic and counterfeit banknotes by electrospray laser desorption ionization/mass spectrometry.

Science.gov (United States)

Kao, Yi-Ying; Cheng, Sy-Chyi; Cheng, Chu-Nian; Shiea, Jentaie

2016-01-01

Electrospray laser desorption ionization is an ambient ionization technique that generates neutrals via laser desorption and ionizes those neutrals in an electrospray plume and was utilized to characterize inks in different layers of copy paper and banknotes of various currencies. Depth profiling of inks was performed on overlapping color bands on copy paper by repeatedly scanning the line with a pulsed laser beam operated at a fixed energy. The molecules in the ink on a banknote were desorbed by irradiating the banknote surface with a laser beam operated at different energies, with results indicating that different ions were detected at different depths. The analysis of authentic $US100, $100 RMB and $1000 NTD banknotes indicated that ions detected in 'color-shifting' and 'typography' regions were significantly different. Additionally, the abundances of some ions dramatically changed with the depth of the aforementioned regions. This approach was used to distinguish authentic $1000 NTD banknotes from counterfeits. Copyright © 2015 John Wiley & Sons, Ltd. Copyright © 2015 John Wiley & Sons, Ltd.

Depth Profiling Analysis of Aluminum Oxidation During Film Deposition in a Conventional High Vacuum System

Science.gov (United States)

Kim, Jongmin; Weimer, Jeffrey J.; Zukic, Muamer; Torr, Douglas G.

1994-01-01

The oxidation of aluminum thin films deposited in a conventional high vacuum chamber has been investigated using x-ray photoelectron spectroscopy (XPS) and depth profiling. The state of the Al layer was preserved by coating it with a protective MgF2 layer in the deposition chamber. Oxygen concentrations in the film layers were determined as a function of sputter time (depth into the film). The results show that an oxidized layer is formed at the start of Al deposition and that a less extensively oxidized Al layer is deposited if the deposition rate is fast. The top surface of the Al layer oxidizes very quickly. This top oxidized layer may be thicker than has been previously reported by optical methods. Maximum oxygen concentrations measured by XPS at each Al interface are related to pressure to rate ratios determined during the Al layer deposition.

Profile in various organic soil depth shrimp pond, Tambak Inti Rakyat, Karawang

Directory of Open Access Journals (Sweden)

Yuni Puji Hastuti

2015-04-01

Full Text Available ABSTRACTOrganic material in the bottom of the pond is part of the land is a complex and dynamic system, which is sourced from the rest of the feed, plants, and or animals found in the soil that continuously change shape, because it is influenced by biology, physics, and chemistry. This study was aimed to see the profile of organic material consisting of C, N, and C/N ratio and phosphate in different depths of pond with different culture systems. Observation were conducted at Tambak Inti Rakyat, Karawang in traditional, semi-intensive and intensive culture systems. Observation at mangrove area was also observed as control. Sediment samples at the inlet and outlet at three different depths (0‒5 cm, 5‒10 cm, and 10‒15 cm was taken every 30 days to measure the content of C, N, C/N ratio, and total phosphate. During the 120 day maintenance period could be known that in all pond systems were used (traditional, semi-intensive, and intensive the concentration of C-organic and organic-N on average was located in the bottom layer which is a layer of 10‒15 cm. The lack of human intervention from ground pond system, the more diverse the type and amount of organic material contained therein.Keywords: organic materials, subgrade, depth, aquaculture systems, long maintenanceABSTRAKBahan organik di dasar tambak merupakan bagian dari tanah yang merupakan suatu sistem kompleks dan dinamis, yang bersumber dari sisa pakan, tanaman, dan atau binatang yang terdapat di dalam tanah yang terus menerus mengalami perubahan bentuk, karena dipengaruhi oleh faktor biologi, fisika, dan kimia. Penelitian ini bertujuan untuk melihat profil bahan organik yang terdiri dari C, N, dan C/N rasio serta fosfat pada kedalaman tambak yang berbeda dengan sistem budidaya yang berbeda pula. Pengamatan dilakukan di Tambak Inti Rakyat Karawang pada sistem budidaya tradisional, semi intensif, dan intensif. Pengamatan di daerah mangrove diamati pula sebagai kontrol. Sampel sedimen di

Iodine-129 depth profiles in soil within 30 km from Fukushima Daiichi Nuclear Power Plant

International Nuclear Information System (INIS)

Honda, M.; Matsuzaki, H.; Tsuchiya, Y.S.; Nakano, C.; Yamagata, T.; Nagai, H.; Matsushi, Y.; Maejima, Y.

2013-01-01

Iodine-129 depth profiles of 13 soil cores were analyzed by AMS to evaluate the distribution and the mobility in soil. The cores were sampled from various fields around the Fukushima Daiichi Nuclear Power Plant (FDNPP). Four cores out of the 13 were collected from almost the same position in Kawauchi village crop field 20 km apart from FDNPP at different times between April 2011 and June 2012 to observe the temporal variation of depth profile of "1"2"9I in soil. On the all of 13 soil cores, clear enhancement of the accident origin "1"2"9I was observed. From the crop field soil cores in Kawauchi village, "1"2"9I inventory was estimated as 43.4±2.7 mBq m"-"2 (3.10x10"1"3 atoms m"-"2). There is positive relationship between relaxation length and the elapsed time since the FDNPP accident. The increase rate of the relaxation length is about 1 cm yr"-"1 which should reflect the downward transfer rate of the Fukushima-derived "1"2"9I. Other 9 cores were collected from various fields including crop fields and man-made soils within 30 km from FDNPP on June 2012. Cumulative "1"2"9I inventory fraction [%] from the surface was calculated. The inventory fraction within top 5 cm varied widely, 65-100% with median 82%. Similarly the inventory fraction within top 10 cm varied 82 to 100% with the median 95%. (author)

Long-range depth profiling of camouflaged targets using single-photon detection

Science.gov (United States)

Tobin, Rachael; Halimi, Abderrahim; McCarthy, Aongus; Ren, Ximing; McEwan, Kenneth J.; McLaughlin, Stephen; Buller, Gerald S.

2018-03-01

We investigate the reconstruction of depth and intensity profiles from data acquired using a custom-designed time-of-flight scanning transceiver based on the time-correlated single-photon counting technique. The system had an operational wavelength of 1550 nm and used a Peltier-cooled InGaAs/InP single-photon avalanche diode detector. Measurements were made of human figures, in plain view and obscured by camouflage netting, from a stand-off distance of 230 m in daylight using only submilliwatt average optical powers. These measurements were analyzed using a pixelwise cross correlation approach and compared to analysis using a bespoke algorithm designed for the restoration of multilayered three-dimensional light detection and ranging images. This algorithm is based on the optimization of a convex cost function composed of a data fidelity term and regularization terms, and the results obtained show that it achieves significant improvements in image quality for multidepth scenarios and for reduced acquisition times.

Measuring depth profiles of residual stress with Raman spectroscopy

Energy Technology Data Exchange (ETDEWEB)

Enloe, W.S.; Sparks, R.G.; Paesler, M.A.

1988-12-01

Knowledge of the variation of residual stress is a very important factor in understanding the properties of machined surfaces. The nature of the residual stress can determine a part`s susceptibility to wear deformation, and cracking. Raman spectroscopy is known to be a very useful technique for measuring residual stress in many materials. These measurements are routinely made with a lateral resolution of 1{mu}m and an accuracy of 0.1 kbar. The variation of stress with depth; however, has not received much attention in the past. A novel technique has been developed that allows quantitative measurement of the variation of the residual stress with depth with an accuracy of 10nm in the z direction. Qualitative techniques for determining whether the stress is varying with depth are presented. It is also demonstrated that when the stress is changing over the volume sampled, errors can be introduced if the variation of the stress with depth is ignored. Computer aided data analysis is used to determine the depth dependence of the residual stress.

Modelling the evolution of composition-and stress-depth profiles in austenitic stainless steels during low-temperature nitriding

DEFF Research Database (Denmark)

Jespersen, Freja Nygaard; Hattel, Jesper Henri; Somers, Marcel A. J.

2016-01-01

. In the present paper solid mechanics was combined with thermodynamics and diffusion kinetics to simulate the evolution of composition-depth and stress-depth profiles resulting from nitriding. The model takes into account a composition-dependent diffusion coefficient of nitrogen in expanded austenite, short range......Nitriding of stainless steel causes a surface zone of expanded austenite, which improves the wear resistance of the stainless steel while preserving the stainless behaviour. During nitriding huge residual stresses are introduced in the treated zone, arising from the volume expansion...... that accompanies the dissolution of high nitrogen contents in expanded austenite. An intriguing phenomenon during low-temperature nitriding is that the residual stresses evoked by dissolution of nitrogen in the solid state, affect the thermodynamics and the diffusion kinetics of nitrogen dissolution...

Microbial Community Dynamics in Soil Depth Profiles Over 120,000 Years of Ecosystem Development

Directory of Open Access Journals (Sweden)

Stephanie Turner

2017-05-01

Full Text Available Along a long-term ecosystem development gradient, soil nutrient contents and mineralogical properties change, therefore probably altering soil microbial communities. However, knowledge about the dynamics of soil microbial communities during long-term ecosystem development including progressive and retrogressive stages is limited, especially in mineral soils. Therefore, microbial abundances (quantitative PCR and community composition (pyrosequencing as well as their controlling soil properties were investigated in soil depth profiles along the 120,000 years old Franz Josef chronosequence (New Zealand. Additionally, in a microcosm incubation experiment the effects of particular soil properties, i.e., soil age, soil organic matter fraction (mineral-associated vs. particulate, O2 status, and carbon and phosphorus additions, on microbial abundances (quantitative PCR and community patterns (T-RFLP were analyzed. The archaeal to bacterial abundance ratio not only increased with soil depth but also with soil age along the chronosequence, coinciding with mineralogical changes and increasing phosphorus limitation. Results of the incubation experiment indicated that archaeal abundances were less impacted by the tested soil parameters compared to Bacteria suggesting that Archaea may better cope with mineral-induced substrate restrictions in subsoils and older soils. Instead, archaeal communities showed a soil age-related compositional shift with the Bathyarchaeota, that were frequently detected in nutrient-poor, low-energy environments, being dominant at the oldest site. However, bacterial communities remained stable with ongoing soil development. In contrast to the abundances, the archaeal compositional shift was associated with the mineralogical gradient. Our study revealed, that archaeal and bacterial communities in whole soil profiles are differently affected by long-term soil development with archaeal communities probably being better adapted to

Depth profiling of {sup 14} N and {sup 20} Ne implantation into iron and steel using(p, gamma) reactions. Vol. 2

Energy Technology Data Exchange (ETDEWEB)

Wriekat, A; Haj-Abdellah, M [Physics Department, University of Jordan, Amman (Jordan)

1996-03-01

Depth profiles of {sup 14} N and {sup 20} Ne ions at 800 KeV implanted into iron and by steel samples have been measured by means of the proton induced {gamma}- ray emission (Pige) technique. The range, R, and range straggling, {Delta}R for these profiles were obtained and compared with theoretical calculations. The experimental results did show that pure iron retains more N and Ne than steel. 2 figs., 1 tab.

Small scale temporal distribution of radiocesium in undisturbed coniferous forest soil: Radiocesium depth distribution profiles.

Science.gov (United States)

Teramage, Mengistu T; Onda, Yuichi; Kato, Hiroaki

2016-04-01

The depth distribution of pre-Fukushima and Fukushima-derived (137)Cs in undisturbed coniferous forest soil was investigated at four sampling dates from nine months to 18 months after the Fukushima nuclear power plant accident. The migration rate and short-term temporal variability among the sampling profiles were evaluated. Taking the time elapsed since the peak deposition of pre-Fukushima (137)Cs and the median depth of the peaks, its downward displacement rates ranged from 0.15 to 0.67 mm yr(-1) with a mean of 0.46 ± 0.25 mm yr(-1). On the other hand, in each examined profile considerable amount of the Fukushima-derived (137)Cs was found in the organic layer (51%-92%). At this moment, the effect of time-distance on the downward distribution of Fukushima-derived (137)Cs seems invisible as its large portion is still found in layers where organic matter is maximal. This indicates that organic matter seems the primary and preferential sorbent of radiocesium that could be associated with the physical blockage of the exchanging sites by organic-rich dusts that act as a buffer against downward propagation of radiocesium, implying radiocesium to be remained in the root zone for considerable time period. As a result, this soil section can be a potential source of radiation dose largely due to high radiocesium concentration coupled with its low density. Generally, such kind of information will be useful to establish a dynamic safety-focused decision support system to ease and assist management actions. Copyright © 2016 Elsevier Ltd. All rights reserved.

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Pacific Remote Island Areas since 2014

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Depth profiling the solid electrolyte interphase on lithium titanate (Li4Ti5O12) using synchrotron-based photoelectron spectroscopy

DEFF Research Database (Denmark)

Nordh, Tim; Younesi, Reza; Brandell, Daniel

2015-01-01

The presence of a surface layer on lithium titanate (Li4Ti5O12, LTO) anodes, which has been a topic of debate in scientific literature, is here investigated with tunable high surface sensitive synchrotron-based photoelectron spectroscopy (PES) to obtain a reliable depth profile of the interphase...

Response function during oxygen sputter profiling and its application to deconvolution of ultrashallow B depth profiles in Si

International Nuclear Information System (INIS)

Shao Lin; Liu Jiarui; Wang Chong; Ma, Ki B.; Zhang Jianming; Chen, John; Tang, Daniel; Patel, Sanjay; Chu Weikan

2003-01-01

The secondary ion mass spectrometry (SIMS) response function to a B 'δ surface layer' has been investigated. Using electron-gun evaporation combined with liquid nitrogen cooling of target, we are able to deposit an ultrathin B layer without detectable island formation. The B spatial distribution obtained from SIMS is exponentially decaying with a decay length approximately a linear function of the incident energy of the oxygen during the SIMS analysis. Deconvolution with the response function has been applied to reconstruct the spatial distribution of ultra-low-energy B implants. A correction to depth and yield scales due to transient sputtering near the Si surface region was also applied. Transient erosion shifts the profile shallower, but beam mixing shifts it deeper. These mutually compensating effects make the adjusted distribution almost the same as original data. The one significant difference is a buried B peak observed near the surface region

Arabian Sea GEOSECS stations revisited: Tracer-depth profiles reveal temporal variations?

International Nuclear Information System (INIS)

Mulsow, S.; Povinec, P.P.; Somayajulu, B.L.K.

2002-01-01

In March-April 1998, the Physical Research Laboratory and the Regional Research Laboratory (Ahmedabad, India) together with the IAEA Marine Environment Laboratory, Monaco, participated in the research mission to visit GEOSECS (Geochemical Ocean Sections Study) stations in the Arabian Sea. The main objective was to reoccupy these stations which were sampled in the early seventies to observe possible time variations in trace behaviour in this region. It is generally accepted that both natural (climate variations) and anthropogenic (greenhouse effect) changes can cause modifications of the oceanic characteristics and properties of deep waters on yearly and decadal scales. For long time-scales (100 to 1000 years) one needs to look at the sediments where these changes are subtly recorded. Tracers such as 14 C and 3 H (deep waters) and 228 Ra surface waters are useful markers of water circulation patterns and changes. Also man-made radiotracers such as 90 Sr, 137 Cs, 99 Tc, 238 Pu, 239 , 240 Pu and 241 Am, can give information on air-sea exchange as well as penetration (vertical change) rates in the open ocean [2]. We visited GEOSECS stations 415 to 419. In each station, CTD profiles, 3 H, 14 C, 90 Sr, 137 Cs, Pu and Am profiles, nutrients, Be, TOC and oxygen were determined from surface to bottom. Also uranium and trace elements were sampled in function of the oxygen minimum zone. In this paper we report the findings on the physical properties as well as the variations in water circulation patterns and also vertical exchange rates in the Arabian Sea. PSU profiles collected in this mission compared with those PSU profiles measured in 1974 (GEOSECS) showed marked differences in those stations located in the southeast part of the Arabian Sea. In contrast, those located more towards the north (415-416) showed little temporal variation. We think these changes may be real given that the PSU values at depth are comparable and reflect the presence of deep Antarctic bottom

Magnitude of shear stress on the san andreas fault: implications of a stress measurement profile at shallow depth.

Science.gov (United States)

Zoback, M D; Roller, J C

1979-10-26

A profile of measurements of shear stress perpendicular to the San Andreas fault near Palmdale, California, shows a marked increase in stress with distance from the fault. The pattern suggests that shear stress on the fault increases slowly with depth and reaches a value on the order of the average stress released during earthquakes. This result has important implications for both long- and shortterm prediction of large earthquakes.

In vivo confocal Raman microscopic determination of depth profiles of the stratum corneum lipid organization influenced by application of various oils.

Science.gov (United States)

Choe, ChunSik; Schleusener, Johannes; Lademann, Jürgen; Darvin, Maxim E

2017-08-01

The intercellular lipids (ICL) of stratum corneum (SC) play an important role in maintaining the skin barrier function. The lateral and lamellar packing order of ICL in SC is not homogenous, but rather depth-dependent. This study aimed to analyze the influence of the topically applied mineral-derived (paraffin and petrolatum) and plant-derived (almond oil and jojoba oil) oils on the depth-dependent ICL profile ordering of the SC in vivo. Confocal Raman microscopy (CRM), a unique tool to analyze the depth profile of the ICL structure non-invasively, is employed to investigate the interaction between oils and human SC in vivo. The results show that the response of SC to oils' permeation varies in the depths. All oils remain in the upper layers of the SC (0-20% of SC thickness) and show predominated differences of ICL ordering from intact skin. In these depths, skin treated with plant-derived oils shows more disordered lateral and lamellar packing order of ICL than intact skin (p0.1), except plant-derived oils at the depth 30% of SC thickness. In the deeper layers of the SC (60-100% of SC thickness), no difference between ICL lateral packing order of the oil-treated and intact skin can be observed, except that at the depths of 70-90% of the SC thickness, where slight changes with more disorder states are measured for plant-derived oil treated skin (p<0.1), which could be explained by the penetration of free fatty acid fractions in the deep-located SC areas. Both oil types remain in the superficial layers of the SC (0-20% of the SC thickness). Skin treated with mineral- and plant-derived oils shows significantly higher disordered lateral and lamellar packing order of ICL in these layers of the SC compared to intact skin. Plant-derived oils significantly changed the ICL ordering in the depths of 30% and 70-90% of the SC thickness, which is likely due to the penetration of free fatty acids in the deeper layers of the SC. Copyright © 2017 Japanese Society for

Oxygen depth profiling using the 16O(d,α)14N nuclear reaction

International Nuclear Information System (INIS)

Khubeis, I.; Al-Rjob, R.

1997-01-01

The excitation function of the 16 O(d,α) 14 N nuclear reaction has been determined in the deuteron energy range of 0.88-2.28 MeV. Major resonances are observed at deuteron energies of 0.98, 1.31, 1.53, 1.60, 1.73 and 2.22 MeV. The present results show good agreement with those of Haase and Khubeis, however there is a shift of 60 keV in the first resonance compared with the measurements of Amsel. The use of a thin surface barrier detector (t=22 μm) and a bias voltage of +20 V coupled with a proper pile-up rejection circuit has allowed the determination of the oxygen depth profiling to a resolution of 16 nm for thick targets. This method is efficient in eliminating interferences from other nuclear reactions such as 16 O(d,p) 17 O and 12 C(d,p) 19 C, where emitted protons have severely obscured α-particles from the 16 O(d,α) 14 N reaction. A 1.08 MeV deuteron beam has been employed to increase the α-yield from the target. The target has been tilted at 70 to enhance depth resolution. This reaction is well suited for the determination of oxygen concentration in oxides of high temperature superconductors. (orig.)

Silicon diodes as an alternative to diamond detectors for depth dose curves and profile measurements of photon and electron radiation

International Nuclear Information System (INIS)

Scherf, Christian; Moog, Jussi; Licher, Joerg; Kara, Eugen; Roedel, Claus; Ramm, Ulla; Peter, Christiane; Zink, Klemens

2009-01-01

Background: Depth dose curves and lateral dose profiles should correspond to relative dose to water in any measured point, what can be more or less satisfied with different detectors. Diamond as detector material has similar dosimetric properties like water. Silicon diodes and ionization chambers are also commonly used to acquire dose profiles. Material and Methods: The authors compared dose profiles measured in an MP3 water phantom with a diamond detector 60003, unshielded and shielded silicon diodes 60008 and 60012 and a 0.125-cm 3 thimble chamber 233642 (PTW, Freiburg, Germany) for 6- and 25-MV photons. Electron beams of 6, 12 and 18 MeV were investigated with the diamond detector, the unshielded diode and a Markus chamber 23343. Results: The unshielded diode revealed relative dose differences at the water surface below +10% for 6-MV and +4% for 25-MV photons compared to the diamond data. These values decreased to less than 1% within the first millimeters of water depth. The shielded diode was only required to obtain correct data of the fall-off zones for photon beams larger than 10 x 10 cm 2 because of important contributions of low-energy scattered photons. For electron radiation the largest relative dose difference of -2% was observed with the unshielded silicon diode for 6 MeV within the build-up zone. Spatial resolutions were always best with the small voluminous silicon diodes. Conclusion: Relative dose profiles obtained with the two silicon diodes have the same degree of accuracy as with the diamond detector. (orig.)

Silicon diodes as an alternative to diamond detectors for depth dose curves and profile measurements of photon and electron radiation.

Science.gov (United States)

Scherf, Christian; Peter, Christiane; Moog, Jussi; Licher, Jörg; Kara, Eugen; Zink, Klemens; Rödel, Claus; Ramm, Ulla

2009-08-01

Depth dose curves and lateral dose profiles should correspond to relative dose to water in any measured point, what can be more or less satisfied with different detectors. Diamond as detector material has similar dosimetric properties like water. Silicon diodes and ionization chambers are also commonly used to acquire dose profiles. The authors compared dose profiles measured in an MP3 water phantom with a diamond detector 60003, unshielded and shielded silicon diodes 60008 and 60012 and a 0.125-cm(3) thimble chamber 233642 (PTW, Freiburg, Germany) for 6- and 25-MV photons. Electron beams of 6, 12 and 18 MeV were investigated with the diamond detector, the unshielded diode and a Markus chamber 23343. The unshielded diode revealed relative dose differences at the water surface below +10% for 6-MV and +4% for 25-MV photons compared to the diamond data. These values decreased to less than 1% within the first millimeters of water depth. The shielded diode was only required to obtain correct data of the fall-off zones for photon beams larger than 10 x 10 cm(2) because of important contributions of low-energy scattered photons. For electron radiation the largest relative dose difference of -2% was observed with the unshielded silicon diode for 6 MeV within the build-up zone. Spatial resolutions were always best with the small voluminous silicon diodes. Relative dose profiles obtained with the two silicon diodes have the same degree of accuracy as with the diamond detector.

Improved quantitative analysis of Cu(In,Ga)Se{sub 2} thin films using MCs{sup +}-SIMS depth profiling

Energy Technology Data Exchange (ETDEWEB)

Lee, Jihye; Kim, Seon Hee; Lee, Kang-Bong; Lee, Yeonhee [Korea Institute of Science and Technology, Advanced Analysis Center, Seoul (Korea, Republic of); Min, Byoung Koun [Korea Institute of Science and Technology, Clean Energy Research Center, Seoul (Korea, Republic of)

2014-06-15

The chalcopyrite semiconductor, Cu(InGa)Se{sub 2} (CIGS), is popular as an absorber material for incorporation in high-efficiency photovoltaic devices because it has an appropriate band gap and a high absorption coefficient. To improve the efficiency of solar cells, many research groups have studied the quantitative characterization of the CIGS absorber layers. In this study, a compositional analysis of a CIGS thin film was performed by depth profiling in secondary ion mass spectrometry (SIMS) with MCs{sup +} (where M denotes an element from the CIGS sample) cluster ion detection, and the relative sensitivity factor of the cluster ion was calculated. The emission of MCs{sup +} ions from CIGS absorber elements, such as Cu, In, Ga, and Se, under Cs{sup +} ion bombardment was investigated using time-of-flight SIMS (TOF-SIMS) and magnetic sector SIMS. The detection of MCs{sup +} ions suppressed the matrix effects of varying concentrations of constituent elements of the CIGS thin films. The atomic concentrations of the CIGS absorber layers from the MCs{sup +}-SIMS exhibited more accurate quantification compared to those of elemental SIMS and agreed with those of inductively coupled plasma atomic emission spectrometry. Both TOF-SIMS and magnetic sector SIMS depth profiles showed a similar MCs{sup +} distribution for the CIGS thin films. (orig.)

Ground-Penetrating-Radar Profiles of Interior Alaska Highways: Interpretation of Stratified Fill, Frost Depths, Water Table, and Thaw Settlement over Ice-Rich Permafrost

Science.gov (United States)

2016-08-01

along either massive ice surfaces or within sections of segregated ice. The uninsulated ice surface at Tok in Figure 17B is irregular. All of the...ER D C/ CR RE L TR -1 6- 14 ERDC’s Center-Directed Research Program Ground -Penetrating-Radar Profiles of Interior Alaska Highways...August 2016 Ground -Penetrating-Radar Profiles of Interior Alaska Highways Interpretation of Stratified Fill, Frost Depths, Water Table, and Thaw

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago in 2013 (NCEI Accession 0161327)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

A one-dimensional Fickian model to predict the Ga depth profiles in three-stage Cu(In,Ga)Se2

International Nuclear Information System (INIS)

Rodriguez-Alvarez, H.; Mainz, R.; Sadewasser, S.

2014-01-01

We present a one-dimensional Fickian model that predicts the formation of a double Ga gradient during the fabrication of Cu(In,Ga)Se 2 thin films by three-stage thermal co-evaporation. The model is based on chemical reaction equations, structural data, and effective Ga diffusivities. In the model, the Cu(In,Ga)Se 2 surface is depleted from Ga during the deposition of Cu-Se in the second deposition stage, leading to an accumulation of Ga near the back contact. During the third deposition stage, where In-Ga-Se is deposited at the surface, the atomic fluxes within the growing layer are inverted. This results in the formation of a double Ga gradient within the Cu(In,Ga)Se 2 layer and reproduces experimentally observed Ga distributions. The final shape of the Ga depth profile strongly depends on the temperatures, times and deposition rates used. The model is used to evaluate possible paths to flatten the marked Ga depth profile that is obtained when depositing at low substrate temperatures. We conclude that inserting Ga during the second deposition stage is an effective way to achieve this.

Chemical weathering of a marine terrace chronosequence, Santa Cruz, California I: Interpreting rates and controls based on soil concentration-depth profiles

Science.gov (United States)

White, A.F.; Schulz, M.S.; Vivit, D.V.; Blum, A.E.; Stonestrom, David A.; Anderson, S.P.

2008-01-01

The spatial and temporal changes in element and mineral concentrations in regolith profiles in a chronosequence developed on marine terraces along coastal California are interpreted in terms of chemical weathering rates and processes. In regoliths up to 15 m deep and 226 kyrs old, quartz-normalized mass transfer coefficients indicate non-stoichiometric preferential release of Sr > Ca > Na from plagioclase along with lesser amounts of K, Rb and Ba derived from K-feldspar. Smectite weathering results in the loss of Mg and concurrent incorporation of Al and Fe into secondary kaolinite and Fe-oxides in shallow argillic horizons. Elemental losses from weathering of the Santa Cruz terraces fall within the range of those for other marine terraces along the Pacific Coast of North America. Residual amounts of plagioclase and K-feldspar decrease with terrace depth and increasing age. The gradient of the weathering profile bs is defined by the ratio of the weathering rate, R to the velocity at which the profile penetrates into the protolith. A spreadsheet calculator further refines profile geometries, demonstrating that the non-linear regions at low residual feldspar concentrations at shallow depth are dominated by exponential changes in mineral surface-to-volume ratios and at high residual feldspar concentrations, at greater depth, by the approach to thermodynamic saturation. These parameters are of secondary importance to the fluid flux qh, which in thermodynamically saturated pore water, controls the weathering velocity and mineral losses from the profiles. Long-term fluid fluxes required to reproduce the feldspar weathering profiles are in agreement with contemporary values based on solute Cl balances (qh = 0.025-0.17 m yr-1). During saturation-controlled and solute-limited weathering, the greater loss of plagioclase relative to K-feldspar is dependent on the large difference in their respective solubilities instead of the small difference between their respective

Depth profile distribution of Cr, Cu, Co, Ni and Pb in the sediment cores of Mumbai Harbour Bay

International Nuclear Information System (INIS)

Madhuparna, D.; Hemalatha, P.; Raj, Sanu S.; Jha, S.K.; Tripathi, R.M.

2014-01-01

Estuarine and coastal sediments act as ultimate sink for trace metals that are discharged into the aquatic environment. Sources of environmental contaminants to the coastal system are numerous and may enter the estuarine environment via a number of pathways Mumbai Harbour Bay on the western coast of India, receives low level nuclear wastes and industrial and domestic sewage waste from the surrounding dwellings. Also, the bay is extensively exploited for various other local activities. The present study was carried out in the bay sediment cores to investigate the depth profile distribution of trace element concentration. Biologically significant toxic elements such as Cr, Cu, Co, Ni and Pb were estimated in the sediment cores to find out pattern of distribution in the sediment bed to follow the accumulation of elements with respect to depth

New Professional Profiles and Skills in the Journalistic Field: A Scoping Review and In-Depth Interviews with Professionals in Spain

Directory of Open Access Journals (Sweden)

Paula Marques-Hayasaki

2016-12-01

Full Text Available The professional profiles and skills related to journalism are adapting to a new paradigm as a consequence of the advent of new technologies - the web 2.0, the end of the monopoly of news production by mass media, etc. This study aims to provide a comprehensive critical mapping of new professional profiles and skills demanded in the field of journalism, based on a scoping review and in-depth interviews with professionals and academics in Spain. The results show a great variety of new profiles and nomenclatures. This is in part because of a significant overlapping in the functions emphasized by them. With regards to skills, the traditional ones are still the most valued by the market, although new competencies are becoming more and more important.

XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

Energy Technology Data Exchange (ETDEWEB)

Jasmin, Jean-Philippe [Laboratoire Analyse et Modélisation pour la Biologie et l’Environnement, UMR 8587, CNRS-Université Evry Val d’Essonne-CEA, 1 rue du père Jarlan, 91025 Evry Cedex (France); Miserque, Frédéric [Den-Service de la Corrosion et du Comportement des Matériaux dans leur Environnement (SCCME), CEA, Université Paris-Saclay, F-91191, Gif-sur-Yvette (France); Dumas, Eddy [Institut Lavoisier de Versailles, UMR 8180, CNRS-Université de Versailles Saint-Quentin-en-Yvelines, 78035 Versailles (France); Vickridge, Ian; Ganem, Jean-Jacques [INSP, UMR 7588, CNRS- Université Pierre et Marie Curie, 4 place Jussieu, boîte courrier 840 75252 Paris, Cedex 05 (France); Cannizzo, Caroline, E-mail: caroline.cannizzo@univ-evry.fr [Laboratoire Analyse et Modélisation pour la Biologie et l’Environnement, UMR 8587, CNRS-Université Evry Val d’Essonne-CEA, 1 rue du père Jarlan, 91025 Evry Cedex (France); Chaussé, Annie [Laboratoire Analyse et Modélisation pour la Biologie et l’Environnement, UMR 8587, CNRS-Université Evry Val d’Essonne-CEA, 1 rue du père Jarlan, 91025 Evry Cedex (France)

2017-03-01

Highlights: • Functionalized nanostructured SPEs were made by multi-step diazonium salt chemistry. • Investigation of SPEs surface by XPS and NRA shows monolayer coverage by aminobenzyl groups. • Complete conversion of aminobenzyl groups into diazonium functions was also evidenced. • Covalent grafting of AuNPs onto SPEs lead to an unusual modification of Au-4f core level spectrum. • Ligand and lead signals showed the interest of nanostructurated SPEs for trace metals detection. - Abstract: An all covalent nanostructured lead sensor was built by the successive grafting of gold nanoparticles and carboxylic ligands at the surface of self-adhesive carbon screen-printed electrodes (SPEs). Surface analysis techniques were used in each step in order to investigate the structuration of this sensor. The self-adhesive surfaces were made from the electrochemical grafting of p-phenylenediamine at the surface of the SPEs via diazonium salts chemistry. The quantity of grafted aniline functions, estimated by Nuclear Reaction Analysis (NRA) performed with p-phenylenediamine labelled with {sup 15}N isotope, is in agreement with an almost complete coverage of the electrode surface. The subsequent diazotization of the aniline functions at the surface of the SPEs was performed; X-ray Photoelectron Spectroscopy (XPS) allowed us to consider a quantitative conversion of the aniline functions into diazonium moieties. The spontaneous grafting of gold nanoparticles on the as-obtained reactive surfaces ensures the nanostructuration of the material, and XPS studies showed that the covalent bonding of the gold nanoparticles at the surface of the SPEs induces a change both in the Au-4f (gold nanoparticles) and Cl-2p (carbon ink) core level signals. These unusual observations are explained by an interaction between the carbon ink constituting the substrate and the gold nanoparticles. Heavy and toxic metals are considered of major environmental concern because of their non

XPS and NRA investigations during the fabrication of gold nanostructured functionalized screen-printed sensors for the detection of metallic pollutants

International Nuclear Information System (INIS)

Jasmin, Jean-Philippe; Miserque, Frédéric; Dumas, Eddy; Vickridge, Ian; Ganem, Jean-Jacques; Cannizzo, Caroline; Chaussé, Annie

2017-01-01

Highlights: • Functionalized nanostructured SPEs were made by multi-step diazonium salt chemistry. • Investigation of SPEs surface by XPS and NRA shows monolayer coverage by aminobenzyl groups. • Complete conversion of aminobenzyl groups into diazonium functions was also evidenced. • Covalent grafting of AuNPs onto SPEs lead to an unusual modification of Au-4f core level spectrum. • Ligand and lead signals showed the interest of nanostructurated SPEs for trace metals detection. - Abstract: An all covalent nanostructured lead sensor was built by the successive grafting of gold nanoparticles and carboxylic ligands at the surface of self-adhesive carbon screen-printed electrodes (SPEs). Surface analysis techniques were used in each step in order to investigate the structuration of this sensor. The self-adhesive surfaces were made from the electrochemical grafting of p-phenylenediamine at the surface of the SPEs via diazonium salts chemistry. The quantity of grafted aniline functions, estimated by Nuclear Reaction Analysis (NRA) performed with p-phenylenediamine labelled with "1"5N isotope, is in agreement with an almost complete coverage of the electrode surface. The subsequent diazotization of the aniline functions at the surface of the SPEs was performed; X-ray Photoelectron Spectroscopy (XPS) allowed us to consider a quantitative conversion of the aniline functions into diazonium moieties. The spontaneous grafting of gold nanoparticles on the as-obtained reactive surfaces ensures the nanostructuration of the material, and XPS studies showed that the covalent bonding of the gold nanoparticles at the surface of the SPEs induces a change both in the Au-4f (gold nanoparticles) and Cl-2p (carbon ink) core level signals. These unusual observations are explained by an interaction between the carbon ink constituting the substrate and the gold nanoparticles. Heavy and toxic metals are considered of major environmental concern because of their non

A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials

Science.gov (United States)

Chatterjee, Shiladitya; Singh, Bhupinder; Diwan, Anubhav; Lee, Zheng Rong; Engelhard, Mark H.; Terry, Jeff; Tolley, H. Dennis; Gallagher, Neal B.; Linford, Matthew R.

2018-03-01

X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are much used analytical techniques that provide information about the outermost atomic and molecular layers of materials. In this work, we discuss the application of multivariate spectral techniques, including principal component analysis (PCA) and multivariate curve resolution (MCR), to the analysis of XPS and ToF-SIMS depth profiles. Multivariate analyses often provide insight into data sets that is not easily obtained in a univariate fashion. Pattern recognition entropy (PRE), which has its roots in Shannon's information theory, is also introduced. This approach is not the same as the mutual information/entropy approaches sometimes used in data processing. A discussion of the theory of each technique is presented. PCA, MCR, and PRE are applied to four different data sets obtained from: a ToF-SIMS depth profile through ca. 100 nm of plasma polymerized C3F6 on Si, a ToF-SIMS depth profile through ca. 100 nm of plasma polymerized PNIPAM (poly (N-isopropylacrylamide)) on Si, an XPS depth profile through a film of SiO2 on Si, and an XPS depth profile through a film of Ta2O5 on Ta. PCA, MCR, and PRE reveal the presence of interfaces in the films, and often indicate that the first few scans in the depth profiles are different from those that follow. PRE and backward difference PRE provide this information in a straightforward fashion. Rises in the PRE signals at interfaces suggest greater complexity to the corresponding spectra. Results from PCA, especially for the higher principal components, were sometimes difficult to understand. MCR analyses were generally more interpretable.

Confocal Raman Microspectroscopy: The Measurement of VX Depth Profiles in Hairless Guinea Pig Skin and the Evaluation of RSDL

Science.gov (United States)

2015-02-01

USAMRICD-TR-15-01 Confocal Raman Microspectroscopy: The Measurement of VX Depth Profiles in Hairless Guinea Pig Skin and the Evaluation...5a. CONTRACT NUMBER guinea pig skin and the evaluation of RSDL 5b. GRANT NUMBER 5c. PROGRAM ELEMENT NUMBER 6. AUTHOR(S) Braue, EH...upper skin layers of hairless guinea pigs and to determine the ability of Reactive Skin Decontamination Lotion (RSDL) to remove or degrade VX from

Pattern and intensity of human impact on coral reefs depend on depth along the reef profile and on the descriptor adopted

Science.gov (United States)

Nepote, Ettore; Bianchi, Carlo Nike; Chiantore, Mariachiara; Morri, Carla; Montefalcone, Monica

2016-09-01

Coral reefs are threatened by multiple global and local disturbances. The Maldives, already heavily hit by the 1998 mass bleaching event, are currently affected also by growing tourism and coastal development that may add to global impacts. Most of the studies investigating effects of local disturbances on coral reefs assessed the response of communities along a horizontal distance from the impact source. This study investigated the status of a Maldivian coral reef around an island where an international touristic airport has been recently (2009-2011) built, at different depths along the reef profile (5-20 m depth) and considering the change in the percentage of cover of five different non-taxonomic descriptors assessed through underwater visual surveys: hard corals, soft corals, other invertebrates, macroalgae and abiotic attributes. Eight reefs in areas not affected by any coastal development were used as controls and showed a reduction of hard coral cover and an increase of abiotic attributes (i.e. sand, rock, coral rubble) at the impacted reef. However, hard coral cover, the most widely used descriptor of coral reef health, was not sufficient on its own to detect subtle indirect effects that occurred down the reef profile. Selecting an array of descriptors and considering different depths, where corals may find a refuge from climate impacts, could guide the efforts of minimising local human pressures on coral reefs.

Contribution to depth profiling by particle induced X-ray emission application to the study of zinc diffusion in AgZn alloy

International Nuclear Information System (INIS)

Frontier, J.P.

1987-08-01

A contribution of the study of the capacities of Particle Induced X-ray Emission (P.I.X.E.) for depth profiling, in the range of 1 to 10 micrometers and over, is presented here. It is shown that, in a non destructuve way, the concentration profile of a given element can be obtained, in principle, by deconvoluting the X-ray yields of this element, measured in a set of experiments in which the energy of the impinging protons, hence their range, is systematically varied. Direct deconvolution procedure, which leads to the inversion of an ill-conditionned matrix is unsuitable. So we generalized the iterative procedure previously used by Vegh to solve a similar problem. Alternatively we also used a fitting procedure of several parameters which gave us somewhat better than those of the iterative procedure. Both algorithms where applied to a set of X-ray yields induced by protons of energy between 0.45 to 2 MeV, corresponding to the first 6 micrometers of various depletion profiles of zinc in an initially homogeneous Ag-3 at % Zn annealed under vacuum. For investigation of deeper layers, a sectionning technique which consists in analysing thin film hydroxide targets by specific chemistry of tiny turning, was developped with success. Cross-reference of all the obtained profiles was made with electron microprobe determination on transverse section, and with the predictions of the theory of atomic diffusion. In addition, the possibilities of increasing the depth resolution by developping techniques either of controled sanding of the surface, or analysis of the sample is discussed [fr

A compact CMA spectrometer with axially integrated hybrid electron-ion gun for ISS, AES and sputter depth profile analysis

International Nuclear Information System (INIS)

Gisler, E.; Bas, E.B.

1986-01-01

Until now, the combined application of electrons and ions in surface analysis required two separate sources for electrons and ions with different incidence angles. The newly developed hybrid electron-ion gun, however, allows bombardment of the same sample area both with noble gas ions and with electrons coming from the same direction. By integrating such a hybrid gun axially in a cylindrical mirror energy analyser (CMA) a sensitive compact single flange spectrometer obtains for ion scattering spectroscopy (ISS), Auger electron spectroscopy (AES), and sputtering all within normal beam incidence. This concept makes accurate beam centering very easy. Additionally, the bombardment from the same direction both for sputtering and for surface analysis brings advantages in depth profiling. The scattering angle for ISS has a constant value of about 138 0 . The hybrid gun delivers typically an electron beam current of -20μA at 3keV for AES, and an ion beam current of +40 nA and +1.2μA at 2 keV for ISS and sputtering respectively. The switching time between ISS, AES, and sputtering mode is about 0.1 s. So this system is best suited for automatically controlled depth profile analysis. The design and operation of this new system will be described and some applications will be discussed. (author)

Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions

Science.gov (United States)

Steinberger, R.; Celedón, C. E.; Bruckner, B.; Roth, D.; Duchoslav, J.; Arndt, M.; Kürnsteiner, P.; Steck, T.; Faderl, J.; Riener, C. K.; Angeli, G.; Bauer, P.; Stifter, D.

2017-07-01

Depth profiling using surface sensitive analysis methods in combination with sputter ion etching is a common procedure for thorough material investigations, where clean surfaces free of any contamination are essential. Hence, surface analytic studies are mostly performed under ultra-high vacuum (UHV) conditions, but the cleanness of such UHV environments is usually overrated. Consequently, the current study highlights the in principle known impact of the residual gas on metal surfaces (Fe, Mg, Al, Cr and Zn) for various surface analytics methods, like X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and low-energy ion scattering (LEIS). The investigations with modern, state-of-the-art equipment showed different behaviors for the metal surfaces in UHV during acquisition: (i) no impact for Zn, even after long time, (ii) solely adsorption of oxygen for Fe, slight and slow changes for Cr and (iii) adsorption accompanied by oxide formation for Al and Mg. The efficiency of different counter measures was tested and the acquired knowledge was finally used for ZnMgAl coated steel to obtain accurate depth profiles, which exhibited before serious artifacts when data acquisition was performed in an inconsiderate way.

A one-dimensional Fickian model to predict the Ga depth profiles in three-stage Cu(In,Ga)Se{sub 2}

Energy Technology Data Exchange (ETDEWEB)

Rodriguez-Alvarez, H., E-mail: humberto.rodriguez@helmholtz-berlin.de [International Iberian Nanotechnology Laboratory, Avenida Mestre Jose Veiga s/n, 4715-330 Braga (Portugal); Helmholtz-Zentrum Berlin, Hahn-Meitner Platz 1, 14109 Berlin (Germany); Mainz, R. [Helmholtz-Zentrum Berlin, Hahn-Meitner Platz 1, 14109 Berlin (Germany); Sadewasser, S. [International Iberian Nanotechnology Laboratory, Avenida Mestre Jose Veiga s/n, 4715-330 Braga (Portugal)

2014-05-28

We present a one-dimensional Fickian model that predicts the formation of a double Ga gradient during the fabrication of Cu(In,Ga)Se{sub 2} thin films by three-stage thermal co-evaporation. The model is based on chemical reaction equations, structural data, and effective Ga diffusivities. In the model, the Cu(In,Ga)Se{sub 2} surface is depleted from Ga during the deposition of Cu-Se in the second deposition stage, leading to an accumulation of Ga near the back contact. During the third deposition stage, where In-Ga-Se is deposited at the surface, the atomic fluxes within the growing layer are inverted. This results in the formation of a double Ga gradient within the Cu(In,Ga)Se{sub 2} layer and reproduces experimentally observed Ga distributions. The final shape of the Ga depth profile strongly depends on the temperatures, times and deposition rates used. The model is used to evaluate possible paths to flatten the marked Ga depth profile that is obtained when depositing at low substrate temperatures. We conclude that inserting Ga during the second deposition stage is an effective way to achieve this.

Effects of recoil-implanted oxygen on depth profiles of defects and annealing processes in P{sup +}-implanted Si studied using monoenergetic positron beams

Energy Technology Data Exchange (ETDEWEB)

Uedono, Akira; Moriya, Tsuyoshi; Tanigawa, Shoichiro [Tsukuba Univ., Ibaraki (Japan). Inst. of Materials Science; Kitano, Tomohisa; Watanabe, Masahito; Kawano, Takao; Suzuki, Ryoichi; Ohdaira, Toshiyuki; Mikado, Tomohisa

1996-04-01

Effects of oxygen atoms recoiled from SiO{sub 2} films on depth profiles of defects and annealing processes in P{sup +}-implanted Si were studied using monoenergetic positron beams. For an epitaxial Si specimen, the depth profile of defects was found to be shifted toward the surface by recoil implantation of oxygen atoms. This was attributed to the formation of vacancy-oxygen complexes and a resultant decrease in the diffusion length of vacancy-type defects. The recoiled oxygen atoms stabilized amorphous regions introduced by P{sup +}-implantation, and the annealing of these regions was observed after rapid thermal annealing (RTA) at 700degC. For a Czochralski-grown Si specimen fabricated by through-oxide implantation, the recoiled oxygen atoms introduced interstitial-type defects upon RTA below the SiO{sub 2}/Si interface, and such defects were dissociated by annealing at 1000degC. (author)

Why bother about depth?

DEFF Research Database (Denmark)

Stæhr, Peter A.; Obrador, Biel; Christensen, Jesper Philip

We present results from a newly developed method to determine depth specific rates of GPP, NEP and R using frequent automated profiles of DO and temperature. Metabolic rate calculations were made for three lakes of different trophic status using a diel DO methodology that integrates rates across...

Prototype development or multi-cavity ion chamber for depth dose measurement

International Nuclear Information System (INIS)

Nayak, M.K.; Sahu, T.K.; Haridas, G.; Bandyopadhyay, Tapas; Tripathi, R.M.; Nandedkar, R.V.

2016-01-01

In high energy electron accelerators, when the electrons interact with vacuum chamber or surrounding structural material, Bremsstrahlung x-rays are produced. It is having a broad spectrum extending up to the electron energies. Dose measured as a function of depth due to electromagnetic cascade will give rise to depth dose curve. To measure the online depth dose profile in an absorber medium, when high energy electron or Bremsstrahlung is incident, a prototype Multi-Cavity Ion Chamber (MCIC) detector is developed. The paper describes the design and development of the MCIC for measurement of depth dose profile

Scanning ion micro-beam techniques for measuring diffusion in heterogeneous materials

International Nuclear Information System (INIS)

Jenneson, P.M.; Clough, A.S.

1998-01-01

A raster scanning MeV micro-beam of 1 H + or 3 He + ions was used to study the diffusion of small molecules in heterogeneous materials. The location of elemental contaminants (heavier than Lithium) in polymer insulated cables was studied with 1 H micro-Particle Induced X-ray Emission (μPIXE). Concentration profiles of a deuterated molecule in a hair fibre were determined with 3 He micro-Nuclear Reaction Analysis (μNRA). Chlorine and heavy water (D 2 0) diffusion into cement pastes were profiled using a combination of 3 He μPIXE and μNRA. (authors)

Quantitative surface analysis using deuteron-induced nuclear reactions

International Nuclear Information System (INIS)

Afarideh, Hossein

1991-01-01

The nuclear reaction analysis (NRA) technique consists of looking at the energies of the reaction products which uniquely define the particular elements present in the sample and it analysis the yield/energy distribution to reveal depth profiles. A summary of the basic features of the nuclear reaction analysis technique is given, in particular emphasis is placed on quantitative light element determination using (d,p) and (d,alpha) reactions. The experimental apparatus is also described. Finally a set of (d,p) spectra for the elements Z=3 to Z=17 using 2 MeV incident deutrons is included together with example of more applications of the (d,alpha) spectra. (author)

Depth-kymography of vocal fold vibrations: part II. Simulations and direct comparisons with 3D profile measurements

Energy Technology Data Exchange (ETDEWEB)

Mul, Frits F M de; George, Nibu A; Qiu Qingjun; Rakhorst, Gerhard; Schutte, Harm K [Department of Biomedical Engineering BMSA, Faculty of Medicine, University Medical Center Groningen UMCG, University of Groningen, PO Box 196, 9700 AD Groningen (Netherlands)], E-mail: ffm@demul.net

2009-07-07

We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is needed, especially when the two folds act differently, e.g. in the case of tumour growth. Recently, with our novel depth-kymographic laryngoscope, we obtained calibrated data about the horizontal and vertical positions of the visible surface of the vibrating vocal folds. In order to find relations with physical parameters such as elasticity and damping constants, we numerically simulated the horizontal and vertical positions and movements of the human vocal folds while vibrating and investigated the effect of varying several parameters on the characteristics of the phonation: the masses and their dimensions, the respective forces and pressures, and the details of the vocal tract compartments. Direct one-to-one comparison with measured 3D positions presents-for the first time-a direct means of validation of these calculations. This may start a new field in vocal folds research.

Depth-kymography of vocal fold vibrations: part II. Simulations and direct comparisons with 3D profile measurements

International Nuclear Information System (INIS)

Mul, Frits F M de; George, Nibu A; Qiu Qingjun; Rakhorst, Gerhard; Schutte, Harm K

2009-01-01

We report novel direct quantitative comparisons between 3D profiling measurements and simulations of human vocal fold vibrations. Until now, in human vocal folds research, only imaging in a horizontal plane was possible. However, for the investigation of several diseases, depth information is needed, especially when the two folds act differently, e.g. in the case of tumour growth. Recently, with our novel depth-kymographic laryngoscope, we obtained calibrated data about the horizontal and vertical positions of the visible surface of the vibrating vocal folds. In order to find relations with physical parameters such as elasticity and damping constants, we numerically simulated the horizontal and vertical positions and movements of the human vocal folds while vibrating and investigated the effect of varying several parameters on the characteristics of the phonation: the masses and their dimensions, the respective forces and pressures, and the details of the vocal tract compartments. Direct one-to-one comparison with measured 3D positions presents-for the first time-a direct means of validation of these calculations. This may start a new field in vocal folds research.

Depth profiling of transport properties of in-situ grown YBa_2Cu_3O_7-x films for coated conductor applications

Science.gov (United States)

Jo, William; Huh, J.-U.; Hammond, R. H.; Beasley, M. R.

2003-03-01

We report depth profiling of the local critical current density and resistivity of YBa_2Cu_3O_7-x (YBCO) films grown by in-situ electron beam evaporation. The method provides important information on the uniformity of the films, and therefore on the commonly observed property that the critical currents of coated conductor high temperature superconductor films do not scale linearly with thickness. Using a methodology of layer-by-layer etching, depth profiling of critical currents and resistivity of the films has been achieved. We use a Bromine methanol mixture to etch down YBCO films with an etch rate of 60 nm/min. At each step, we also observe surface morphology using high resolution scanning electron microscopy. In this talk, we report further study of the results found earlier that YBCO films deposited at high rates are composed of an upper layer of defected YBCO with a local Jc of 5 - 7 MA/cm^2 and a lower more perfect layer with no critical current capacity. The information derived may be useful in the characterization and optimization of superconducting thin films for electrical power and other applications.

Lithium diffusion in polyether ether ketone and polyimide stimulated by in situ electron irradiation and studied by the neutron depth profiling method

Czech Academy of Sciences Publication Activity Database

Vacík, Jiří; Hnatowicz, Vladimír; Attar, F. M. D.; Mathakari, N. L.; Dahiwale, S. S.; Dhole, S. D.; Bhoraskar, V. N.

2014-01-01

Roč. 169, č. 10 (2014), s. 885-891 ISSN 1042-0150 R&D Projects: GA ČR(CZ) GBP108/12/G108; GA MŠk(XE) LM2011019 Institutional support: RVO:61389005 Keywords : diffusion * lithium * neutron depth profiling * polymers Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders Impact factor: 0.513, year: 2014

Buoyancy frequency profiles and internal semidiurnal tide turning depths in the oceans

NARCIS (Netherlands)

King, B.; Stone, M.; Zhang, H.P.; Gerkema, T.; Marder, M.; Scott, R.B.; Swinney, H.L.

2012-01-01

We examine the possible existence of internal gravity wave "turning depths," depths below which the local buoyancy frequency N(z) becomes smaller than the wave frequency. At a turning depth, incident gravity waves reflect rather than reaching the ocean bottom as is generally assumed. Here we

Ion beam sputtering and depth profiling: on the characteristics of the induced roughness and the means to cure it at best

International Nuclear Information System (INIS)

Limoge, Y.; Maurice, F.; Zemskoff, A.

1987-01-01

The purpose of the present communication is to report the first results of a study devoted to the understanding of the surface roughness due either to statistical fluctuations in sputtering or sample microstructural inhomogeneities. In a second part, we shall propose a new method to correct the experimental profiles from the blurring effect of the sample roughness in typical cases of in-depth analysis

Structural and magnetic depth profiles of magneto-ionic heterostructures beyond the interface limit

Energy Technology Data Exchange (ETDEWEB)

Gilbert, DA; Grutter, AJ; Arenholz, E; Liu, K; Kirby, BJ; Borchers, JA; Maranville, BB

2016-07-22

Electric field control of magnetism provides a promising route towards ultralow power information storage and sensor technologies. The effects of magneto-ionic motion have been prominently featured in the modification of interface characteristics. Here, we demonstrate magnetoelectric coupling moderated by voltage-driven oxygen migration beyond the interface in relatively thick AlO_x/GdO_x/Co(15 nm) films. Oxygen migration and Co magnetization are quantitatively mapped with polarized neutron reflectometry under electro-thermal conditioning. The depth-resolved profiles uniquely identify interfacial and bulk behaviours and a semi-reversible control of the magnetization. Magnetometry measurements suggest changes in the microstructure which disrupt long-range ferromagnetic ordering, resulting in an additional magnetically soft phase. X-ray spectroscopy confirms changes in the Co oxidation state, but not in the Gd, suggesting that the GdO_x transmits oxygen but does not source or sink it. These results together provide crucial insight into controlling magnetism via magneto-ionic motion, both at interfaces and throughout the bulk of the films.

Rooting depth and root depth distribution of Trifolium repens × T. uniflorum interspecific hybrids.

Science.gov (United States)

Nichols, S N; Hofmann, R W; Williams, W M; van Koten, C

2016-05-20

Traits related to root depth distribution were examined in Trifolium repens × T. uniflorum backcross 1 (BC 1 ) hybrids to determine whether root characteristics of white clover could be improved by interspecific hybridization. Two white clover cultivars, two T. uniflorum accessions and two BC 1 populations were grown in 1 -m deep tubes of sand culture. Maximum rooting depth and root mass distribution were measured at four harvests over time, and root distribution data were fitted with a regression model to provide measures of root system shape. Morphological traits were measured at two depths at harvest 3. Root system shape of the hybrids was more similar to T. uniflorum than to white clover. The hybrids and T. uniflorum had a higher rate of decrease in root mass with depth than white clover, which would result in higher proportions of root mass in the upper profile. Percentage total root mass at 100-200 mm depth was higher for T. uniflorum than white clover, and for Crusader BC 1 than 'Crusader'. Roots of the hybrids and T. uniflorum also penetrated deeper than those of white clover. T. uniflorum had thicker roots at 50-100 mm deep than the other entries, and more of its fine root mass at 400-500 mm. The hybrids and white clover had more of their fine root mass higher in the profile. Consequently, T. uniflorum had a higher root length density at 400-500 mm than most entries, and a smaller decrease in root length density with depth. These results demonstrate that rooting characteristics of white clover can be altered by hybridization with T. uniflorum, potentially improving water and nutrient acquisition and drought resistance. Root traits of T. uniflorum are likely to be adaptations to soil moisture and fertility in its natural environment. © The Author 2016. Published by Oxford University Press on behalf of the Annals of Botany Company. All rights reserved. For Permissions, please email: journals.permissions@oup.com.

Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C{sub 60}{sup +}-Ar{sup +} co-sputtering

Energy Technology Data Exchange (ETDEWEB)

Chang, Chi-Jen [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Chang, Hsun-Yun; You, Yun-Wen; Liao, Hua-Yang [Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China); Kuo, Yu-Ting; Kao, Wei-Lun; Yen, Guo-Ji; Tsai, Meng-Hung [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Shyue, Jing-Jong, E-mail: shyue@gate.sinica.edu.tw [Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan (China); Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan (China)

2012-03-09

Highlights: Black-Right-Pointing-Pointer Multiple peptides are detected and quantified at the same time without labeling. Black-Right-Pointing-Pointer C{sub 60}{sup +} ion is responsible for generating molecular-specific ions at high mass. Black-Right-Pointing-Pointer The co-sputtering yielded more steady depth profile and more well defined interface. Black-Right-Pointing-Pointer The fluence of auxiliary Ar{sup +} does not affect the quantification curve. Black-Right-Pointing-Pointer The damage from Ar{sup +} is masked by high sputtering yield of C{sub 60}{sup +}. - Abstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) using pulsed C{sub 60}{sup +} primary ions is a promising technique for analyzing biological specimens with high surface sensitivities. With molecular secondary ions of high masses, multiple molecules can be identified simultaneously without prior separation or isotope labeling. Previous reports using the C{sub 60}{sup +} primary ion have been based on static-SIMS, which makes depth profiling complicated. Therefore, a dynamic-SIMS technique is reported here. Mixed peptides in the cryoprotectant trehalose were used as a model for evaluating the parameters that lead to the parallel detection and quantification of biomaterials. Trehalose was mixed separately with different concentrations of peptides. The peptide secondary ion intensities (normalized with respect to those of trehalose) were directly proportional to their concentration in the matrix (0.01-2.5 mol%). Quantification curves for each peptide were generated by plotting the percentage of peptides in trehalose versus the normalized SIMS intensities. Using these curves, the parallel detection, identification, and quantification of multiple peptides was achieved. Low energy Ar{sup +} was used to co-sputter and ionize the peptide-doped trehalose sample to suppress the carbon deposition associated with C{sub 60}{sup +} bombardment, which suppressed the ion intensities during the depth

Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

International Nuclear Information System (INIS)

Reinsberg, K.-G.; Schumacher, C.; Tempez, A.; Nielsch, K.; Broekaert, J.A.C.

2012-01-01

In this work the depth-profile analysis of thermoelectric layers deposited on Au and Cr covered Si wafers with the aid of pulsed radiofrequency glow discharge time-of-flight mass spectrometry (pulsed RF-GD-TOFMS also called plasma profiling TOFMS (PP-TOFMS™)) is described. For thermoelectric materials the depth resolutions obtained with both PP-TOFMS and secondary ion mass spectrometry (SIMS) are shown to be well comparable and in the order of the roughness of the corresponding layers (between 20 and 3700 nm). With both methods a direct solid analysis without any preparation steps is possible. In addition, the analysis of the samples with PP-TOFMS proved to be faster by a factor of 26 compared to SIMS, as sputtering rates were found to be 80 nm s −1 and 3 nm s −1 , respectively. For the analyzed samples the results of PP-TOFMS and SIMS show that a homogeneous deposition was obtained. Quantitative results for all samples could also be obtained directly by PP-TOFMS when the stoichiometry of one sample was determined beforehand for instance by inductively coupled plasma optical emission spectrometry (ICP-OES) and scanning electron microscopy energy dispersive X-ray fluorescence spectrometry (SEM-EDX). For Bi 2 Te 3 the standard deviation for the main component concentrations within one sample then is found to be between 1.1% and 1.9% and it is 3.6% from sample to sample. For Sb 2 Te 3 the values within one sample are from 1.7% to 4.2% and from sample to sample 5.3%, respectively. - Highlights: ► Depth resolution in sub micrometer size by glow discharge mass spectrometry. ► Bi and Sb telluride layers composition with GD-TOF-MS, ICP-OES and SEM-EDX agree. ► Homogeneities of layers measured with GD-TOF-MS and SIMS agree.

A summary report on the search for current technologies and developers to develop depth profiling/physical parameter end effectors

International Nuclear Information System (INIS)

Nguyen, Q.H.

1994-01-01

This report documents the search strategies and results for available technologies and developers to develop tank waste depth profiling/physical parameter sensors. Sources searched include worldwide research reports, technical papers, journals, private industries, and work at Westinghouse Hanford Company (WHC) at Richland site. Tank waste physical parameters of interest are: abrasiveness, compressive strength, corrosiveness, density, pH, particle size/shape, porosity, radiation, settling velocity, shear strength, shear wave velocity, tensile strength, temperature, viscosity, and viscoelasticity. A list of related articles or sources for each physical parameters is provided

A summary report on the search for current technologies and developers to develop depth profiling/physical parameter end effectors

Energy Technology Data Exchange (ETDEWEB)

Nguyen, Q.H.

1994-09-12

This report documents the search strategies and results for available technologies and developers to develop tank waste depth profiling/physical parameter sensors. Sources searched include worldwide research reports, technical papers, journals, private industries, and work at Westinghouse Hanford Company (WHC) at Richland site. Tank waste physical parameters of interest are: abrasiveness, compressive strength, corrosiveness, density, pH, particle size/shape, porosity, radiation, settling velocity, shear strength, shear wave velocity, tensile strength, temperature, viscosity, and viscoelasticity. A list of related articles or sources for each physical parameters is provided.

Computations Of Critical Depth In Rivers With Flood Plains | Okoli ...

African Journals Online (AJOL)

Critical flows may occur at more than one depth in rivers with flood plains. The possibility of multiple critical depths affects the water-surface profile calculations. Presently available algorithms determine only one of the critical depths which may lead to large errors. It is the purpose of this paper to present an analytical ...

Temperature profile and water depth data collected from USS THACH using BT and XBT casts in the Persian Sea for 1987-11-21 (NODC Accession 8800016)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS THACH in the Persian Sea. Data were collected from 21 November 1987 to 21...

ChiMS: Open-source instrument control software platform on LabVIEW for imaging/depth profiling mass spectrometers.

Science.gov (United States)

Cui, Yang; Hanley, Luke

2015-06-01

ChiMS is an open-source data acquisition and control software program written within LabVIEW for high speed imaging and depth profiling mass spectrometers. ChiMS can also transfer large datasets from a digitizer to computer memory at high repetition rate, save data to hard disk at high throughput, and perform high speed data processing. The data acquisition mode generally simulates a digital oscilloscope, but with peripheral devices integrated for control as well as advanced data sorting and processing capabilities. Customized user-designed experiments can be easily written based on several included templates. ChiMS is additionally well suited to non-laser based mass spectrometers imaging and various other experiments in laser physics, physical chemistry, and surface science.

Temperature profile and water depth data collected from TOWERS in the NE Atlantic (limit-180 W) from 06 June 1986 to 29 August 1986 (NODC Accession 8600378)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the TOWERS in the Northeast Atlantic Ocean, South China Sea, Philippine Sea, and...

Quantitative sputter profiling at surfaces and interfaces

International Nuclear Information System (INIS)

Kirschner, J.; Etzkorn, H.W.

1981-01-01

The key problem in quantitative sputter profiling, that of a sliding depth scale has been solved by combined Auger/X-ray microanalysis. By means of this technique and for the model system Ge/Si (amorphous) the following questions are treated quantitatively: shape of the sputter profiles when sputtering through an interface and origin of their asymmetry; precise location of the interface plane on the depth profile; broadening effects due to limited depth of information and their correction; origin and amount of bombardment induced broadening for different primary ions and energies; depth dependence of the broadening, and basic limits to depth resolution. Comparisons are made to recent theoretical calculations based on recoil mixing in the collision cascade and very good agreement is found

Spectrometric kidney depth measurement method

International Nuclear Information System (INIS)

George, P.; Soussaline, F.; Raynaud, C.

1976-01-01

The method proposed uses the single posterior surface measurement of the kidney radioactivity distribution. The ratio C/P of the number of scattered photons to the number of primary photons, which is a function of the tissue depth penetrated, is calculated for a given region. The parameters on which the C/P value depends are determined from studies on phantoms. On the basis of these results the kidney depth was measured on a series of 13 patients and a correlation was established between the value thus calculated and that obtained by the profile method. The reproducibility of the method is satisfactory [fr

Electrochemical depth profiling of multilayer metallic structures: An aluminum brazing sheet

DEFF Research Database (Denmark)

Afshar, F. Norouzi; Ambat, R.; Kwakernaak, C.

2012-01-01

Combinatory localized electrochemical cell and glow discharge optical emission spectrometry (GDOES) measurements were performed to obtain a thorough in depth electrochemical characterization of an aluminum brazing sheet. By defining electrochemical criteria i.e. breakdown potential, corrosion...... potential, cathodic and anodic reactivities, and tracking their changes as a function of depth, the evolution of electrochemical responses through out the material thickness were analyzed and correlated to the corresponding microstructural features. Polarization curves in 1wt% NaCl solution at pH 2.8 were...... obtained at different depths from the surface using controlled sputtering in a glow discharge optical emission spectrometer as a sample preparation technique. The anodic and cathodic reactivity of the top surface areas were significantly higher than that of the bulk, thus indicating these areas to be more...

Instability of Hydrogenated TiO2

Energy Technology Data Exchange (ETDEWEB)

Nandasiri, Manjula I.; Shutthanandan, V.; Manandhar, Sandeep; Schwarz, Ashleigh M.; Oxenford, Lucas S.; Kennedy, John V.; Thevuthasan, Suntharampillai; Henderson, Michael A.

2015-11-06

Hydrogenated TiO2 (H-TiO2) is toted as a viable visible light photocatalyst. We report a systematic study on the thermal stability of H-implanted TiO2 using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), Rutherford backscattering spectrometry (RBS) and nuclear reaction analysis (NRA). Protons (40 keV) implanted at a ~2 atom % level within a ~120 nm wide profile of rutile TiO2(110) were situated ~300 nm below the surface. NRA revealed that this H-profile broadened preferentially toward the surface after annealing at 373 K, dissipated out of the crystal into vacuum at 473 K, and was absent within the beam sampling depth (~800 nm) at 523 K. Photoemission showed that the surface was reduced in concert with these changes. Similar anneals had no effect on pristine TiO2(110). The facile bulk diffusivity of H in rutile, as well as its activity toward interfacial reduction, significantly limits the utilization of H-TiO2 as a photocatalyst. This work was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, Division of Chemical Sciences, Geosciences & Biosciences. Pacific Northwest National Laboratory (PNNL) is a multiprogram national laboratory operated for DOE by Battelle. The research was performed using the Environmental Molecular Sciences Laboratory (EMSL), a national scientific user facility sponsored by the Department of Energy's Office of Biological and Environmental Research and located at Pacific Northwest National Laboratory.

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across Wake Island from 2014-03-16 to 2014-03-19 (NCEI Accession 0162248)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across Jarvis Island from 2016-05-19 to 2016-05-23 (NCEI Accession 0162245)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across American Samoa from 2015-02-15 to 2015-03-28 (NCEI Accession 0161169)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

The Beryllium 7 Depth Distribution Study

International Nuclear Information System (INIS)

Jalal Sharib; Zainudin Othman; Dainee Nor Fardzila Ahmad Tugi

2014-01-01

The aim of this paper is to study the evolution of 7Be depth distribution in a soil profile. The soil samples have been collected by using plastic core in bare area in Bangi, Malaysia. Each of the soil core samples has been sectioned into 2 mm increments to a depth of 4 cm and the samples are subsequently oven dried at 45°C and gently disaggregated. The sample is passed through a < 2 mm sieve and packed into plastic pot for 7Be analysis using gamma spectrometry with a 24 hour count time. From the findings, show the 7Be depth penetration from this study decreases exponentially with depth and is confined within the top few centimeters and similar with other works been reported. The further discussion for this findings will be presented in full paper. (author)

Depth Profiling of La2O3 ∕ HfO2 Stacked Dielectrics for Nanoelectronic Device Applications

KAUST Repository

Alshareef, Husam N.

2011-01-03

Nanoscale La2O3 /HfO2 dielectric stacks have been studied using high resolution Rutherford backscattering spectrometry. The measured distance of the tail-end of the La signal from the dielectric/Si interface suggests that the origin of the threshold voltage shifts and the carrier mobility degradation may not be the same. Up to 20% drop in mobility and 500 mV shift in threshold voltage was observed as the La signal reached the Si substrate. Possible reasons for these changes are proposed, aided by depth profiling and bonding analysis. © 2011 The Electrochemical Society.

Hydrogen analysis depth calibration by CORTEO Monte-Carlo simulation

Energy Technology Data Exchange (ETDEWEB)

Moser, M., E-mail: marcus.moser@unibw.de [Universität der Bundeswehr München, Institut für Angewandte Physik und Messtechnik LRT2, Fakultät für Luft- und Raumfahrttechnik, 85577 Neubiberg (Germany); Reichart, P.; Bergmaier, A.; Greubel, C. [Universität der Bundeswehr München, Institut für Angewandte Physik und Messtechnik LRT2, Fakultät für Luft- und Raumfahrttechnik, 85577 Neubiberg (Germany); Schiettekatte, F. [Université de Montréal, Département de Physique, Montréal, QC H3C 3J7 (Canada); Dollinger, G., E-mail: guenther.dollinger@unibw.de [Universität der Bundeswehr München, Institut für Angewandte Physik und Messtechnik LRT2, Fakultät für Luft- und Raumfahrttechnik, 85577 Neubiberg (Germany)

2016-03-15

Hydrogen imaging with sub-μm lateral resolution and sub-ppm sensitivity has become possible with coincident proton–proton (pp) scattering analysis (Reichart et al., 2004). Depth information is evaluated from the energy sum signal with respect to energy loss of both protons on their path through the sample. In first order, there is no angular dependence due to elastic scattering. In second order, a path length effect due to different energy loss on the paths of the protons causes an angular dependence of the energy sum. Therefore, the energy sum signal has to be de-convoluted depending on the matrix composition, i.e. mainly the atomic number Z, in order to get a depth calibrated hydrogen profile. Although the path effect can be calculated analytically in first order, multiple scattering effects lead to significant deviations in the depth profile. Hence, in our new approach, we use the CORTEO Monte-Carlo code (Schiettekatte, 2008) in order to calculate the depth of a coincidence event depending on the scattering angle. The code takes individual detector geometry into account. In this paper we show, that the code correctly reproduces measured pp-scattering energy spectra with roughness effects considered. With more than 100 μm thick Mylar-sandwich targets (Si, Fe, Ge) we demonstrate the deconvolution of the energy spectra on our current multistrip detector at the microprobe SNAKE at the Munich tandem accelerator lab. As a result, hydrogen profiles can be evaluated with an accuracy in depth of about 1% of the sample thickness.

Direct depth distribution measurement of deuterium in bulk tungsten exposed to high-flux plasma

Directory of Open Access Journals (Sweden)

C. N. Taylor

2017-05-01

Full Text Available Understanding tritium retention and permeation in plasma-facing components is critical for fusion safety and fuel cycle control. Glow discharge optical emission spectroscopy (GD-OES is shown to be an effective tool to reveal the depth profile of deuterium in tungsten. Results confirm the detection of deuterium. A ∼46 μm depth profile revealed that the deuterium content decreased precipitously in the first 7 μm, and detectable amounts were observed to depths in excess of 20 μm. The large probing depth of GD-OES (up to 100s of μm enables studies not previously accessible to the more conventional techniques for investigating deuterium retention. Of particular applicability is the use of GD-OES to measure the depth profile for experiments where high deuterium concentration in the bulk material is expected: deuterium retention in neutron irradiated materials, and ultra-high deuterium fluences in burning plasma environment.

Temperature profile and water depth data collected from HARRIOT LANE in the NW Atlantic (limit-40 W) from 20 February 1987 to 22 February 1987 (NODC Accession 8700096)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the HARRIOT LANE in the Northwest Atlantic Ocean and TOGA Area - Atlantic Ocean. Data...

Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the NW Atlantic Ocean for 1987-05-31 (NODC Accession 8700225)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC Harriot Lane in the Northwest Atlantic Ocean and TOGA Area - Atlantic...

Analysis of hydrogen isotopes in materials by secondary ion mass spectrometry and nuclear microanalysis

International Nuclear Information System (INIS)

Ross, G.G.

1994-01-01

Only two techniques are really appropriate for the depth profiling of hydrogen isotopes: nuclear microanalysis (NMA) and secondary ion mass spectrometry (SIMS). The intent of this paper is to give an up to date review of both techniques and to show how they can be used in conjunction. Both techniques (SIMS and NMA) will be described briefly. NMA will divided into two different categories: nuclear reaction analysis (NRA) and elastic recoil detection (ERD). Both techniques (SIMS and NMA) will be discussed in terms of sensitivity, resolution, probing depth, quantitative measurement, generality and selectivity, beam induced effects and surface roughness effects. The principal advantages and disadvantages of each of these techniques will be specified, supporting the contention that SIMS and NMA are complementary and should be used in conjunction. Finally, some examples of, and perspectives for, the complementary use of both techniques will be presented. (Author)

Bayesian inversion of a CRN depth profile to infer Quaternary erosion of the northwestern Campine Plateau (NE Belgium

Directory of Open Access Journals (Sweden)

E. Laloy

2017-07-01

Full Text Available The rate at which low-lying sandy areas in temperate regions, such as the Campine Plateau (NE Belgium, have been eroding during the Quaternary is a matter of debate. Current knowledge on the average pace of landscape evolution in the Campine area is largely based on geological inferences and modern analogies. We performed a Bayesian inversion of an in situ-produced 10Be concentration depth profile to infer the average long-term erosion rate together with two other parameters: the surface exposure age and the inherited 10Be concentration. Compared to the latest advances in probabilistic inversion of cosmogenic radionuclide (CRN data, our approach has the following two innovative components: it (1 uses Markov chain Monte Carlo (MCMC sampling and (2 accounts (under certain assumptions for the contribution of model errors to posterior uncertainty. To investigate to what extent our approach differs from the state of the art in practice, a comparison against the Bayesian inversion method implemented in the CRONUScalc program is made. Both approaches identify similar maximum a posteriori (MAP parameter values, but posterior parameter and predictive uncertainty derived using the method taken in CRONUScalc is moderately underestimated. A simple way for producing more consistent uncertainty estimates with the CRONUScalc-like method in the presence of model errors is therefore suggested. Our inferred erosion rate of 39 ± 8. 9 mm kyr−1 (1σ is relatively large in comparison with landforms that erode under comparable (paleo-climates elsewhere in the world. We evaluate this value in the light of the erodibility of the substrate and sudden base level lowering during the Middle Pleistocene. A denser sampling scheme of a two-nuclide concentration depth profile would allow for better inferred erosion rate resolution, and including more uncertain parameters in the MCMC inversion.

Bayesian inversion of a CRN depth profile to infer Quaternary erosion of the northwestern Campine Plateau (NE Belgium)

Science.gov (United States)

Laloy, Eric; Beerten, Koen; Vanacker, Veerle; Christl, Marcus; Rogiers, Bart; Wouters, Laurent

2017-07-01

The rate at which low-lying sandy areas in temperate regions, such as the Campine Plateau (NE Belgium), have been eroding during the Quaternary is a matter of debate. Current knowledge on the average pace of landscape evolution in the Campine area is largely based on geological inferences and modern analogies. We performed a Bayesian inversion of an in situ-produced 10Be concentration depth profile to infer the average long-term erosion rate together with two other parameters: the surface exposure age and the inherited 10Be concentration. Compared to the latest advances in probabilistic inversion of cosmogenic radionuclide (CRN) data, our approach has the following two innovative components: it (1) uses Markov chain Monte Carlo (MCMC) sampling and (2) accounts (under certain assumptions) for the contribution of model errors to posterior uncertainty. To investigate to what extent our approach differs from the state of the art in practice, a comparison against the Bayesian inversion method implemented in the CRONUScalc program is made. Both approaches identify similar maximum a posteriori (MAP) parameter values, but posterior parameter and predictive uncertainty derived using the method taken in CRONUScalc is moderately underestimated. A simple way for producing more consistent uncertainty estimates with the CRONUScalc-like method in the presence of model errors is therefore suggested. Our inferred erosion rate of 39 ± 8. 9 mm kyr-1 (1σ) is relatively large in comparison with landforms that erode under comparable (paleo-)climates elsewhere in the world. We evaluate this value in the light of the erodibility of the substrate and sudden base level lowering during the Middle Pleistocene. A denser sampling scheme of a two-nuclide concentration depth profile would allow for better inferred erosion rate resolution, and including more uncertain parameters in the MCMC inversion.

Chemical changes in PMMA as a function of depth due to proton beam irradiation

International Nuclear Information System (INIS)

Szilasi, S.Z.; Huszank, R.; Szikra, D.; Vaczi, T.; Rajta, I.; Nagy, I.

2011-01-01

Highlights: → Chemical changes were investigated as a function of depth in proton irradiated PMMA → The depth profile of numerous functional groups was determined along the depth → The degree of chemical modification strongly depends on the LET of protons → At low-fluences the zone of maximal modification is restricted to the Bragg peak → At higher fluences the zone of max. modification extends towards the sample surface. - Abstract: In this work we determined depth profiles of the chemical change in PMMA irradiated with 2 MeV protons by infrared spectroscopic and micro-Raman measurements. The measurements were carried out on 10 μm thin stacked foil samples using an infrared spectrometer in universal attenuated total reflectance (UATR) and transmission modes; while the thick samples were analyzed with a confocal micro-Raman spectrometer. The depth profiles of the changes formed due to the various delivered fluences were compared to each other. The measurements show the strong dependence of the degree of modification on the energy transfer from the decelerating protons. Depth profiles reveal that at the fluences applied in this work the entire irradiated volume suffered some chemical modifications. In case of low-fluence samples the zone of maximal modification is restricted only to the Bragg peak, but with increasing fluences the region of maximal modification extends towards the sample surface.

Temperature profile and water depth data collected from HARRIOT LANE in the NW Atlantic (limit-40 W) from 29 December 1986 to 31 December 1986 (NODC Accession 8700074)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XTB casts in the NW Atlantic Ocean from the HARRIOT LANE. Data were collected from 29 December...

Temperature profile and water depth data collected from COCHRANE in the South China Sea and other seas from 09 January 1987 to 22 February 1987 (NODC Accession 8700095)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the COCHRANE in the South China and other seas. Data were collected from 09 January...

Depth sensitivity of Lexan polycarbonate detector

CERN Document Server

Awad, E M

1999-01-01

The dependence of the registration sensitivity of Lexan polycarbonate with depth inside the detector was studied. Samples of Lexan from General Electric were irradiated to two long range ions. These were Ni and Au ions with a projectile energy of 0.3 and 1 GeV/n. Two independent techniques, the track-diameter technique (TDT) and the track profile technique (TPT), were used. The registration sensitivity was measured at depths of 7, 10, 15, 18, 20, 28, 35 and 40 mu m inside the detector. The results of the two techniques show that the detector sensitivity decreases gradually with the depth inside the detector. It reaches 20 % less compared to sensitivity at the surface after 40 mu m have been removed.

Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Reinsberg, K.-G. [Institute for Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, D-20146 Hamburg (Germany); Schumacher, C. [Institute for Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany); Tempez, A. [HORIBA Jobin Yvon, 16-18 rue du Canal, F-91160 Longjumeau (France); Nielsch, K. [Institute for Applied Physics, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg (Germany); Broekaert, J.A.C., E-mail: jose.broekaert@chemie.uni-hamburg.de [Institute for Inorganic and Applied Chemistry, University of Hamburg, Martin-Luther-King-Platz 6, D-20146 Hamburg (Germany)

2012-10-15

In this work the depth-profile analysis of thermoelectric layers deposited on Au and Cr covered Si wafers with the aid of pulsed radiofrequency glow discharge time-of-flight mass spectrometry (pulsed RF-GD-TOFMS also called plasma profiling TOFMS (PP-TOFMS Trade-Mark-Sign )) is described. For thermoelectric materials the depth resolutions obtained with both PP-TOFMS and secondary ion mass spectrometry (SIMS) are shown to be well comparable and in the order of the roughness of the corresponding layers (between 20 and 3700 nm). With both methods a direct solid analysis without any preparation steps is possible. In addition, the analysis of the samples with PP-TOFMS proved to be faster by a factor of 26 compared to SIMS, as sputtering rates were found to be 80 nm s{sup -1} and 3 nm s{sup -1}, respectively. For the analyzed samples the results of PP-TOFMS and SIMS show that a homogeneous deposition was obtained. Quantitative results for all samples could also be obtained directly by PP-TOFMS when the stoichiometry of one sample was determined beforehand for instance by inductively coupled plasma optical emission spectrometry (ICP-OES) and scanning electron microscopy energy dispersive X-ray fluorescence spectrometry (SEM-EDX). For Bi{sub 2}Te{sub 3} the standard deviation for the main component concentrations within one sample then is found to be between 1.1% and 1.9% and it is 3.6% from sample to sample. For Sb{sub 2}Te{sub 3} the values within one sample are from 1.7% to 4.2% and from sample to sample 5.3%, respectively. - Highlights: Black-Right-Pointing-Pointer Depth resolution in sub micrometer size by glow discharge mass spectrometry. Black-Right-Pointing-Pointer Bi and Sb telluride layers composition with GD-TOF-MS, ICP-OES and SEM-EDX agree. Black-Right-Pointing-Pointer Homogeneities of layers measured with GD-TOF-MS and SIMS agree.

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Mariana Archipelago from 2014-03-24 to 2014-05-05 (NCEI Accession 0161168)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Hawaiian Archipelago from 2016-09-01 to 2016-09-27 (NCEI Accession 0161171)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Improving depth resolutions in positron beam spectroscopy by concurrent ion-beam sputtering

Science.gov (United States)

John, Marco; Dalla, Ayham; Ibrahim, Alaa M.; Anwand, Wolfgang; Wagner, Andreas; Böttger, Roman; Krause-Rehberg, Reinhard

2018-05-01

The depth resolution of mono-energetic positron annihilation spectroscopy using a positron beam is shown to improve by concurrently removing the sample surface layer during positron beam spectroscopy. During ion-beam sputtering with argon ions, Doppler-broadening spectroscopy is performed with energies ranging from 3 keV to 5 keV allowing for high-resolution defect studies just below the sputtered surface. With this technique, significantly improved depth resolutions could be obtained even at larger depths when compared to standard positron beam experiments which suffer from extended positron implantation profiles at higher positron energies. Our results show that it is possible to investigate layered structures with a thickness of about 4 microns with significantly improved depth resolution. We demonstrated that a purposely generated ion-beam induced defect profile in a silicon sample could be resolved employing the new technique. A depth resolution of less than 100 nm could be reached.

Data-based depth estimation of an incoming autonomous underwater vehicle.

Science.gov (United States)

Yang, T C; Xu, Wen

2016-10-01

The data-based method for estimating the depth of a moving source is demonstrated experimentally for an incoming autonomous underwater vehicle traveling toward a vertical line array (VLA) of receivers at constant speed/depth. The method assumes no information on the sound-speed and bottom profile. Performing a wavenumber analysis of a narrowband signal for each hydrophone, the energy of the (modal) spectral peaks as a function of the receiver depth is used to estimate the depth of the source, traveling within the depth span of the VLA. This paper reviews the theory, discusses practical implementation issues, and presents the data analysis results.

Quantitative damage depth profiles in arsenic implanted HgCdTe

Energy Technology Data Exchange (ETDEWEB)

Lobre, C., E-mail: clement.lobre@cea.fr [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Jalabert, D. [CEA-INAC/UJF-Grenoble 1 UMR-E, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Vickridge, I.; Briand, E.; Benzeggouta, D. [Institut des NanoSciences de Paris, UMR 7588 du CNRS, Universite de Pierre et Marie Curie, Paris (France); Mollard, L. [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Jouneau, P.H. [CEA-INAC/UJF-Grenoble 1 UMR-E, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France); Ballet, P. [CEA-Leti, MINATEC, 17 rue des Martyrs, 38054 Grenoble cedex 9 (France)

2013-10-15

Rutherford backscattering experiments under channeling conditions (RBS-c) have been carried out on Hg{sub 0.77}Cd{sub 0.23}Te (MCT) layers implanted with arsenic. Accurate damage profiles have been extracted through a simple formalism for implanted and annealed layers. Quantitative damage profiles are correlated with structural defects observed by bright-field scanning transmission electron microscopy (BF-STEM) and chemical composition measured by secondary ion mass spectrometry (SIMS). Evolution of damage for increasing ion implantation fluence has been investigated by these three complementary techniques. Evidence is found of irradiation induced annealing during implantation. A fast damage recovery has been observed for post-implantation thermal anneals. In the case of an implanted layer annealed during 1 h, the damage profile, associated with arsenic concentration measurements, indicates the presence of complexes involving arsenic.

Quantitative damage depth profiles in arsenic implanted HgCdTe

International Nuclear Information System (INIS)

Lobre, C.; Jalabert, D.; Vickridge, I.; Briand, E.; Benzeggouta, D.; Mollard, L.; Jouneau, P.H.; Ballet, P.

2013-01-01

Rutherford backscattering experiments under channeling conditions (RBS-c) have been carried out on Hg 0.77 Cd 0.23 Te (MCT) layers implanted with arsenic. Accurate damage profiles have been extracted through a simple formalism for implanted and annealed layers. Quantitative damage profiles are correlated with structural defects observed by bright-field scanning transmission electron microscopy (BF-STEM) and chemical composition measured by secondary ion mass spectrometry (SIMS). Evolution of damage for increasing ion implantation fluence has been investigated by these three complementary techniques. Evidence is found of irradiation induced annealing during implantation. A fast damage recovery has been observed for post-implantation thermal anneals. In the case of an implanted layer annealed during 1 h, the damage profile, associated with arsenic concentration measurements, indicates the presence of complexes involving arsenic

Nitrate and sulfate reducers-retrievable number of bacteria and their activities in Indian waters

Digital Repository Service at National Institute of Oceanography (India)

LokaBharathi, P.A.; Nair, S.; Chandramohan, D.

Culturable heterotrophic, nitrate reducing and sulfate reducing bacteria (HB, NRB and SRB) were enumerated from 25, 50, 100 and 200 m depths at 15 stations and their potential activities viz. Nitrate reducing (NRA) and Sulfate reducing (SRA) were...

Scanning Auger microscopy for high lateral and depth elemental sensitivity

Energy Technology Data Exchange (ETDEWEB)

Martinez, E., E-mail: eugenie.martinez@cea.fr [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Yadav, P. [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Bouttemy, M. [Institut Lavoisier de Versailles, 45 av. des Etats-Unis, 78035 Versailles Cedex (France); Renault, O.; Borowik, Ł.; Bertin, F. [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France); Etcheberry, A. [Institut Lavoisier de Versailles, 45 av. des Etats-Unis, 78035 Versailles Cedex (France); Chabli, A. [CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9 (France)

2013-12-15

Highlights: •SAM performances and limitations are illustrated on real practical cases such as the analysis of nanowires and nanodots. •High spatial elemental resolution is shown with the analysis of reference semiconducting Al{sub 0.7}Ga{sub 0.3}As/GaAs multilayers. •High in-depth elemental resolution is also illustrated. Auger depth profiling with low energy ion beams allows revealing ultra-thin layers (∼1 nm). •Analysis of cross-sectional samples is another effective approach to obtain in-depth elemental information. -- Abstract: Scanning Auger microscopy is currently gaining interest for investigating nanostructures or thin multilayers stacks developed for nanotechnologies. New generation Auger nanoprobes combine high lateral (∼10 nm), energy (0.1%) and depth (∼2 nm) resolutions thus offering the possibility to analyze the elemental composition as well as the chemical state, at the nanometre scale. We report here on the performances and limitations on practical examples from nanotechnology research. The spatial elemental sensitivity is illustrated with the analysis of Al{sub 0.7}Ga{sub 0.3}As/GaAs heterostructures, Si nanowires and SiC nanodots. Regarding the elemental in-depth composition, two effective approaches are presented: low energy depth profiling to reveal ultra-thin layers (∼1 nm) and analysis of cross-sectional samples.

A comparison of mixing depths observed over horizontally inhomogeneous terrain

Energy Technology Data Exchange (ETDEWEB)

White, A.B. [Univ. of Colorado/NOAA Environmental Technology Lab., Cooperative Inst. for Research in Environmental Sciences, Boulder, CO (United States); King, C.W. [NOAA Environmental Technology Lab., Boulder, CO (United States)

1997-10-01

In this paper we used wind profiler observations to estimate the mixing depth on either side of the Continental Divide on days when a PTBC (plain-to-basin-circulation) occurred along the Front Range of Colorado during the summer of 1995. The mixing depths on the basin side were significantly deeper than the mountain barrier for all of the PTBC events we analyzed. On the plains side, the mixed layers often extended to or above the level of the mountain barrier. On certain days up-slope flow existed above the mixed layer. We depicted the vertical structure of the flow and features in the humidity profile on one of these days using measurements from a wind profiler. The results were consistent with the conceptual model presented by Wolyn and McKee (1994). (au)

IBA analysis of some precolumbian gilded-copper samples

Science.gov (United States)

Andrade, E.; Murillo, G.; Policroniades, R.; Acosta, L.; Zavala, E. P.; Rocha, M. F.; Centeno, S. A.

2005-10-01

The elemental composition and depth profiles obtained by IBA techniques on some gilded-copper fragments from the Moche site of Loma Negra, in the Piura Valley, on the Northern Coast of Perú are presented in this article. A previous radiocarbon dating of a wooden fragment indicated that Loma Negra was occupied around 295 AD. A PIXE analysis using a 2.6 MeV external proton beam, was used to obtain the concentration of trace elements in the samples. RBS analyses using 2.72 MeV 4He+ and 12.0 MeV 12C3+ were used to obtain the Au, Ag, Cu atomic profiles. NRA with a 1.02 MeV deuteron beam was used to measure the oxygen and carbon concentrations through the 16O(d,p) 17O, 16O(d,α) 14N and 12C(d,p0) 13C reactions.

Temperature profile and water depth data collected from SAXON STAR and other platforms in a World wide distribution from 09 March 1983 to 12 November 1986 (NODC Accession 8700035)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the SAXON STAR and other platforms in a World wide distribution. Data were collected...

Multiple scattering effects in depth resolution of elastic recoil detection

International Nuclear Information System (INIS)

Wielunski, L.S.; Harding, G.L.

1998-01-01

Elastic Recoil Detection (ERD) is used to profile hydrogen and other low mass elements in thin films at surface and interfaces in a similar way that Rutherford Backscattering Spectroscopy (RBS) is used to detect and profile heavy elements. It is often assumed that the depth resolutions of these two techniques are similar. However, in contrast to typical RBS, the depth resolution of ERD is limited substantially by multiple scattering. In experimental data analysis and/or spectra simulations of a typical RBS measurement multiple scattering effects are often ignored. Computer programs used in IBA, such as RUMP, HYPRA or RBX do not include multiple scattering effects at all. In this paper, using practical thin metal structures with films containing intentionally introduced hydrogen, we demonstrate experimental ERD depth resolution and sensitivity limitations. The effects of sample material and scattering angle are also discussed. (authors)

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Northwestern Hawaiian Islands from 2015-07-31 to 2015-08-19 (NCEI Accession 0161170)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Quantitative AMS depth profiling of the hydrogen isotopes collected in graphite divertor and wall tiles of the tokamak ASDEX-Upgrade

International Nuclear Information System (INIS)

Sun, G.Y.; Friedrich, M.; Groetzschel, R.; Buerger, W.; Behrisch, R.; Garcia-Rosales, C.

1997-01-01

The accelerator mass spectrometry (AMS) facility at the 3 MV Tandetron in Rossendorf has been applied for quantitative depth profiling of deuterium and tritium in samples cut from graphite protection tiles at the vessel walls of the fusion experiment ASDEX-Upgrade at the Max-Planck-Institut fuer Plasmaphysik in Garching. The tritium originates from D(d,p)T fusion reactions in the plasma and it is implanted in the vessel walls together with deuterium atoms and ions from the plasma. The T concentrations in the surface layers down to the analyzing depth of about 25 μm are in the range of 10 11 to 5 x 10 15 T-atoms/cm 3 corresponding to a tritium retention of 3 x 10 10 to 3.5 x 10 12 T-atoms/cm 2 . The much higher deuterium concentrations in the samples were simultaneously measured by calibrated conventional SIMS. In the surface layers down to the analyzing depth of about 25 μm the deuterium concentrations are between 3 x 10 18 and 8 x 10 21 atoms/cm 3 , corresponding to a deuterium retention of 2.5 x 10 16 to 2.5 x 10 18 atoms/cm 2 The estimated total amount of tritium in the vessel walls is of the same order of magnitude as the total number of neutrons produced in D(d,n) 3 He reactions. (orig.)

Auger and depth profile analysis of synthetic crystals for dispersion of soft x-rays

International Nuclear Information System (INIS)

Rachocki, K.D.; Brown, D.R.; Springer, R.W.; Arendt, P.N.

1983-01-01

Numerous samples have been fabricated and analyzed as part of a program to produce soft x-ray dispersion elements for various laboratory applications. The majority of this work has centered around the carbon/tungsten system, although several other low-Z/high-Z pairs have been investigated. This report describes the development of certain vacuum-deposition techniques for fabricating these dispersion elements, based upon results obtained from x-ray reflectivity measurements and Auger depth-profile analysis. The composition of the films is chiefly alternating layers of tungsten carbide and carbon. Excess carbon is introduced during the deposition of the tungsten to ensure that the carbide layer is fully stoichiometric. Layer thickness ranged from approx. 5 to 30 A for the carbide and from approx. 15 to 80 A for the carbon. The reflectivity measurements were made using Fe and Al K/sub α/ at grazing incidence. The emphasis in these studies is on the application of surface-analysis results in suggesting modifications to the fabrication process and in evaluating the results such modifications have on the layer stoichiometry, continuity, and periodicity of the dispersion elements so produced

Depth distribution of displacement damage in α-iron under triple beam ion irradiation

International Nuclear Information System (INIS)

Horton, L.L.; Bentley, J.; Jesser, W.A.

1981-01-01

The depth dependence of the defect structures was determined for iron irradiated at 850 0 K with 4 MeV Fe 2+ and energetic helium and deuteron ions to 10 dpa and fusion levels of helium and deuterium. From the damage profiles, a sectioning depth of 0.9 μm was selected for studies of iron and bcc iron alloys, such as ferritic steels, utilizing similar irradiation parameters. A comparison of the experimental damage profile to the deposited energy and deposited ion profiles calculated by E-DEP-1 indicated a possible overestimate of the LSS stopping power of at least 22%

Depth distribution of nitrogen in silicon from plasma ion implantation

International Nuclear Information System (INIS)

Vajo, J.J.; Williams, J.D.; Wei, R.; Wilson, R.G.; Matossian, J.N.

1994-01-01

Plasma Ion Implantation (PII) is an ion implantation technique that eliminates the line-of-sight restriction of conventional ion-beam implantation and therefore allows for cost effective surface modification of large-scale objects or large-number of small-scale objects. In PII, a part to be implanted is immersed in a low-pressure (10 -4 --10 -5 Torr), partially-ionized plasma that surrounds the part with a plasma sheath. The part is negatively pulse biased up to 100 keV using a repetitive train (100--1,000 Hz) of short-duration (10--40 μsec) voltage pulses. The applied voltage develops across the sheath and accelerates plasma ions into the surface, implanting them omnidirectionally and simultaneously over the entire surface of the part. The depth distribution of the implanted ions influences the extent and type of surface modification achieved and depends upon many factors. These include three rise and fall time of the voltage-pulse waveform, the voltage-pulse amplitude, the ion specie, the ion density, and the temperature of the target. Understanding the contributions to the depth distribution from each of these factors will enable prediction of conditions that will be useful for implantation of large complex parts. To investigate the contributions to the measured depth distributions from these factors nitrogen, predominantly as N + 2 , has been implanted into silicon using PII at 50 and 100 keV (25 and 50 keV per N atom). The implanted depth distributions have been determined using secondary ion mass spectroscopy and Auger electron spectroscopy depth profiling. The distributions differ from the typical, approximately Gaussian, profiles that result from conventional mass selected monoenergetic ion beam implantation. In comparison with ion beam implants and numerical simulations the profiles appear ''filled-in'' with an approximately constant nitrogen concentration for depths less than the expected average ion range

Improving Focal Depth Estimates: Studies of Depth Phase Detection at Regional Distances

Science.gov (United States)

Stroujkova, A.; Reiter, D. T.; Shumway, R. H.

2006-12-01

The accurate estimation of the depth of small, regionally recorded events continues to be an important and difficult explosion monitoring research problem. Depth phases (free surface reflections) are the primary tool that seismologists use to constrain the depth of a seismic event. When depth phases from an event are detected, an accurate source depth is easily found by using the delay times of the depth phases relative to the P wave and a velocity profile near the source. Cepstral techniques, including cepstral F-statistics, represent a class of methods designed for the depth-phase detection and identification; however, they offer only a moderate level of success at epicentral distances less than 15°. This is due to complexities in the Pn coda, which can lead to numerous false detections in addition to the true phase detection. Therefore, cepstral methods cannot be used independently to reliably identify depth phases. Other evidence, such as apparent velocities, amplitudes and frequency content, must be used to confirm whether the phase is truly a depth phase. In this study we used a variety of array methods to estimate apparent phase velocities and arrival azimuths, including beam-forming, semblance analysis, MUltiple SIgnal Classification (MUSIC) (e.g., Schmidt, 1979), and cross-correlation (e.g., Cansi, 1995; Tibuleac and Herrin, 1997). To facilitate the processing and comparison of results, we developed a MATLAB-based processing tool, which allows application of all of these techniques (i.e., augmented cepstral processing) in a single environment. The main objective of this research was to combine the results of three focal-depth estimation techniques and their associated standard errors into a statistically valid unified depth estimate. The three techniques include: 1. Direct focal depth estimate from the depth-phase arrival times picked via augmented cepstral processing. 2. Hypocenter location from direct and surface-reflected arrivals observed on sparse

Depth Profiling (ICP-MS Study of Toxic Metal Buildup in Concrete Matrices: Potential Environmental Impact

Directory of Open Access Journals (Sweden)

Ghada Bassioni

2010-10-01

Full Text Available This paper explores the potential of concrete material to accumulate toxic trace elements using ablative laser technology (ICP-MS. Concrete existing in offshore structures submerged in seawater acts as a sink for hazardous metals, which could be gradually released into the ocean creating pollution and anoxic conditions for marine life. Ablative laser technology is a valuable tool for depth profiling concrete to evaluate the distribution of toxic metals and locate internal areas where such metals accumulate. Upon rapid degradation of concrete these “hotspots” could be suddenly released, thus posing a distinct threat to aquatic life. Our work simulated offshore drilling conditions by immersing concrete blocks in seawater and investigating accumulated toxic trace metals (As, Be, Cd, Hg, Os, Pb in cored samples by laser ablation. The experimental results showed distinct inhomogeneity in metal distribution. The data suggest that conditions within the concrete structure are favorable for random metal accumulation at certain points. The exact mechanism for this behavior is not clear at this stage and has considerable scope for extended research including modeling and remedial studies.

Investigation of hydrogen micro-kinetics in metals with ion beam implantation and analysis

International Nuclear Information System (INIS)

Wang, T.S.; Peng, H.B.; Lv, H.Y.; Han, Y.C.; Grambole, D.; Herrmann, F.

2007-01-01

One of the most important subjects in the fusion material research is to study the hydrogen and helium concentration, diffusion and evolution in the structure material of fusion reactor, since the hydrogen and helium can be continuously produced by the large dose fast neutron irradiation on material. Various analysis Methods can be used, but the ion beam analysis method has some advantages for studying the hydrogen behaviors in nano- or micrometer resolution. In this work, the hydrogen motion and three-dimensional distribution after implantation into metal has been studied by resonance NRA, micro-ERDA and XRD etc Methods. The resolution of the H-depth-profile is in nanometer level and the lateral resolution can be reached to 2 micrometers. The evolution of hydrogen depth-profile in a titanium sample has been studied versus the change of normal stress in samples. Evident hydrogen diffusion has been observed, while a normal stress is changed in the range of 107-963 MPa. A new phase transformation during the hydrogenation is observed by the in-situ XRD analysis. The further study on the hydrogen behaviors in the structure materials of fusion reactor is in plan. (authors)

Depth resolution of secondary ion mass spectrometry

International Nuclear Information System (INIS)

Pustovit, A.N.

2004-01-01

The effect of the solid body discreteness in the direction of the normal to the sample surface on the depth resolution of the secondary ion mass spectrometry method is analyzed. It is shown that for this case the dependence of the width at the semi-height of the delta profiles of the studied elements depth distribution on the energy and angle of incidence of the initial ions should have the form of the stepwise function. This is experimentally proved by the silicon-germanium delta-layers in the silicon samples [ru

Temperature profile and water depth data collected from RATHBURNE in the NW Pacific (limit-180 W) and other areas from 02 February 1986 to 28 February 1986 (NODC Accession 8600093)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT from the RATHBURNE in the Northwest Pacific Ocean and other areas. Data were collected from...

Hydrologic regulation of plant rooting depth.

Science.gov (United States)

Fan, Ying; Miguez-Macho, Gonzalo; Jobbágy, Esteban G; Jackson, Robert B; Otero-Casal, Carlos

2017-10-03

Plant rooting depth affects ecosystem resilience to environmental stress such as drought. Deep roots connect deep soil/groundwater to the atmosphere, thus influencing the hydrologic cycle and climate. Deep roots enhance bedrock weathering, thus regulating the long-term carbon cycle. However, we know little about how deep roots go and why. Here, we present a global synthesis of 2,200 root observations of >1,000 species along biotic (life form, genus) and abiotic (precipitation, soil, drainage) gradients. Results reveal strong sensitivities of rooting depth to local soil water profiles determined by precipitation infiltration depth from the top (reflecting climate and soil), and groundwater table depth from below (reflecting topography-driven land drainage). In well-drained uplands, rooting depth follows infiltration depth; in waterlogged lowlands, roots stay shallow, avoiding oxygen stress below the water table; in between, high productivity and drought can send roots many meters down to the groundwater capillary fringe. This framework explains the contrasting rooting depths observed under the same climate for the same species but at distinct topographic positions. We assess the global significance of these hydrologic mechanisms by estimating root water-uptake depths using an inverse model, based on observed productivity and atmosphere, at 30″ (∼1-km) global grids to capture the topography critical to soil hydrology. The resulting patterns of plant rooting depth bear a strong topographic and hydrologic signature at landscape to global scales. They underscore a fundamental plant-water feedback pathway that may be critical to understanding plant-mediated global change.

Hydrologic regulation of plant rooting depth

Science.gov (United States)

Fan, Ying; Miguez-Macho, Gonzalo; Jobbágy, Esteban G.; Jackson, Robert B.; Otero-Casal, Carlos

2017-10-01

Plant rooting depth affects ecosystem resilience to environmental stress such as drought. Deep roots connect deep soil/groundwater to the atmosphere, thus influencing the hydrologic cycle and climate. Deep roots enhance bedrock weathering, thus regulating the long-term carbon cycle. However, we know little about how deep roots go and why. Here, we present a global synthesis of 2,200 root observations of >1,000 species along biotic (life form, genus) and abiotic (precipitation, soil, drainage) gradients. Results reveal strong sensitivities of rooting depth to local soil water profiles determined by precipitation infiltration depth from the top (reflecting climate and soil), and groundwater table depth from below (reflecting topography-driven land drainage). In well-drained uplands, rooting depth follows infiltration depth; in waterlogged lowlands, roots stay shallow, avoiding oxygen stress below the water table; in between, high productivity and drought can send roots many meters down to the groundwater capillary fringe. This framework explains the contrasting rooting depths observed under the same climate for the same species but at distinct topographic positions. We assess the global significance of these hydrologic mechanisms by estimating root water-uptake depths using an inverse model, based on observed productivity and atmosphere, at 30″ (˜1-km) global grids to capture the topography critical to soil hydrology. The resulting patterns of plant rooting depth bear a strong topographic and hydrologic signature at landscape to global scales. They underscore a fundamental plant-water feedback pathway that may be critical to understanding plant-mediated global change.

Multiple scattering effects in depth resolution of elastic recoil detection

Energy Technology Data Exchange (ETDEWEB)

Wielunski, L.S.; Harding, G.L. [Commonwealth Scientific and Industrial Research Organisation (CSIRO), Lindfield, NSW (Australia). Telecommunications and Industrial Physics; Szilagyi, E. [KFKI Research Institute for Particle and Nuclear Physics, Budapest, (Hungary)

1998-06-01

Elastic Recoil Detection (ERD) is used to profile hydrogen and other low mass elements in thin films at surface and interfaces in a similar way that Rutherford Backscattering Spectroscopy (RBS) is used to detect and profile heavy elements. It is often assumed that the depth resolutions of these two techniques are similar. However, in contrast to typical RBS, the depth resolution of ERD is limited substantially by multiple scattering. In experimental data analysis and/or spectra simulations of a typical RBS measurement multiple scattering effects are often ignored. Computer programs used in IBA, such as RUMP, HYPRA or RBX do not include multiple scattering effects at all. In this paper, using practical thin metal structures with films containing intentionally introduced hydrogen, we demonstrate experimental ERD depth resolution and sensitivity limitations. The effects of sample material and scattering angle are also discussed. (authors). 19 refs., 4 figs.

Temperature profile and water depth data collected from BROOKE using BT and XBT casts in the North Pacific Ocean from 03 October 1975 to 18 November 1977 (NODC Accession 8900225)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the BROOKE in the North Pacific Ocean and TOGA Area - Pacific Ocean. Data were...

Temperature profile and water depth data from BT and XBT casts in the Atlantic Ocean from USCGC POLAR SEA from 14 December 1983 to 06 May 1984 (NODC Accession 8600108)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC POLAR SEA in the Atlantic Ocean. Data were collected from 14 December...

National Coral Reef Monitoring Program: Shallow Water Conductivity-Temperature-Depth (CTD) Profiles for selected locations across the Pacific Remote Island Areas from 2015-01-26 to 2015-04-28 (NCEI Accession 0162247)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Near-shore shallow water Conductivity-Temperature-Depth (CTD) surveys provided vertical profiles of temperature, salinity, and turbidity providing indications for...

Reference depth for geostrophic computation - A new method

Digital Repository Service at National Institute of Oceanography (India)

Varkey, M.J.; Sastry, J.S.

Various methods are available for the determination of reference depth for geostrophic computation. A new method based on the vertical profiles of mean and variance of the differences of mean specific volume anomaly (delta x 10) for different layers...

Depth profile investigation of the incorporated iron atoms during Kr{sup +} ion beam sputtering on Si (001)

Energy Technology Data Exchange (ETDEWEB)

Khanbabaee, B., E-mail: khanbabaee@physik.uni-siegen.de [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Arezki, B.; Biermanns, A. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany); Cornejo, M.; Hirsch, D. [Leibniz-Institut für Oberflächenmodifizierung e. V. (IOM), Permoserstraße 15, D-04318 Leipzig (Germany); Lützenkirchen-Hecht, D. [Abteilung Physik, Bergische Universität Wuppertal, D-42097 Wuppertal (Germany); Frost, F. [Leibniz-Institut für Oberflächenmodifizierung e. V. (IOM), Permoserstraße 15, D-04318 Leipzig (Germany); Pietsch, U. [Solid State Physics, University of Siegen, D-57068 Siegen (Germany)

2013-01-01

We investigate the incorporation of iron atoms during nano-patterning of Si surfaces induced by 2 keV Kr{sup +} ion beam erosion under an off-normal incidence angle of 15°. Considering the low penetration depth of the ions, we have used X-ray reflectivity (XRR) and X-ray absorption near edge spectroscopy (XANES) under grazing-incidence angles in order to determine the depth profile and phase composition of the incorporated iron atoms in the near surface region, complemented by secondary ion mass spectrometry and atomic force microscopy. XRR analysis shows the accumulation of metallic atoms within a near surface layer of a few nanometer thickness. We verify that surface pattern formation takes place only when the co-sputtered Fe concentration exceeds a certain limit. For high Fe concentration, the ripple formation is accompanied by the enhancement of Fe close to the surface, whereas no Fe enhancement is found for low Fe concentration at samples with smooth surfaces. Modeling of the measured XANES spectra reveals the appearance of different silicide phases with decreasing Fe content from the top towards the volume. - Highlights: ► We investigate the incorporation of iron atoms during nano-patterning of Si surfaces. ► Pattern formation occurs when the areal density of Fe exceeds a certain threshold. ► X-ray reflectivity shows a layering at near surface due to incorporated Fe atoms. ► It is shown that the patterning is accompanied with the appearance of Fe-rich silicide.

Temperature profile and water depth data collected from USS THACH using BT and XBT casts in the Persian Sea from 04 December 1987 to 08 December 1987 (NODC Accession 8800030)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS THACH in the Persian Sea. Data were collected from 04 December 1987 to 08...

The Spatial Variability of Beryllium-7 Depth Distribution Study

International Nuclear Information System (INIS)

Jalal Sharib; Zainudin Othman; Dainee Nor Fardzila Ahmad Tugi; Noor Fadzilah Yusof; Mohd Tarmizi Ishak

2015-01-01

The objective of this paper is to study the spatial variability of 7 Be depth evolution in soil profile at two different sampling sites. The soil samples have been collected by using metal core in bare area in Bangi, Selangor and Timah Tasoh, Perlis , Malaysia. Two composite core samples for each sampling sites has been sectioned into 2 mm increments to a depth of 4 cm and oven dried at 45- 60 degree Celsius and gently desegregated. These two composite spatial samples are passed through a < 2 mm sieve and packed into proper geometry plastic container for 7 Be analysis by using gamma spectrometry with a 24-hour count time. From the findings, the 7 Be content in the soil samples from Bangi, Selangor study area is distributed lower depth penetration into the soil profile than Timah Tasoh, Perlis catchment due to many factors such as precipitation (fallout) and others. However, the spatial variability from both samples study area is also decreases exponentially with depth and is confined within the top few centimeters and similar with other works been reported (Blake et al., (2000) and Walling et al.,(2008). Furthermore, a detailed discussion from this study findings will be in full papers. (author)

Temperature profile and water depth collected from ZAMBEZE and other platforms using BT and XBT casts in the Atlantic Ocean from 21 July 1981 to 02 December 1985 (NODC Accession 8600293)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the ZAMBEZE and other platforms in the Northeast / Southwest Atlantic Ocean. Data...

Temperature profile and water depth data collected from USS McInerney from expendable bathythermographs (XBT) in the Red Sea from 07 December 1992 to 28 December 1992 (NODC Accession 9300017)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS McInerney in the Red Sea. Data were collected from 07 December 1992 to 28...

A small and compact AMS facility for tritium depth profiling

Indian Academy of Sciences (India)

Depth profiling measurements of tritium in carbon samples have been performed during the past seven years at the AMS facility installed at the Rossendorf 3 MV Tandetron. The samples have been cut from the inner walls of the fusion experiments ASDEX-upgrade/Garching and JET/Culham. The tritium content of the ...

Temperature profile and water depth data collected from AMERICAN VIKING using BT and XBT casts in the Northeast Pacific Ocean from 23 September 1986 to 17 September 1987 (NODC Accession 8800048)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the AMERICAN VIKING in the Northeast Pacific Ocean. Data were collected from 23...

Temperature profile and water depth data collected from ANGO and other platforms using XBT casts in the TOGA Area - Atlantic from 14 February 1992 to 13 April 1993 (NODC Accession 9400047)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using XBT casts from the ANGO and other platforms in the TOGA - Atlantic Ocean. Data were collected from 14...

LOGISTIC FUNCTION PROFILE FIT: A least-squares program for fitting interface profiles to an extended logistic function

International Nuclear Information System (INIS)

Kirchhoff, William H.

2012-01-01

The extended logistic function provides a physically reasonable description of interfaces such as depth profiles or line scans of surface topological or compositional features. It describes these interfaces with the minimum number of parameters, namely, position, width, and asymmetry. Logistic Function Profile Fit (LFPF) is a robust, least-squares fitting program in which the nonlinear extended logistic function is linearized by a Taylor series expansion (equivalent to a Newton–Raphson approach) with no apparent introduction of bias in the analysis. The program provides reliable confidence limits for the parameters when systematic errors are minimal and provides a display of the residuals from the fit for the detection of systematic errors. The program will aid researchers in applying ASTM E1636-10, “Standard practice for analytically describing sputter-depth-profile and linescan-profile data by an extended logistic function,” and may also prove useful in applying ISO 18516: 2006, “Surface chemical analysis—Auger electron spectroscopy and x-ray photoelectron spectroscopy—determination of lateral resolution.” Examples are given of LFPF fits to a secondary ion mass spectrometry depth profile, an Auger surface line scan, and synthetic data generated to exhibit known systematic errors for examining the significance of such errors to the extrapolation of partial profiles.

IBA analysis of some precolumbian gilded-copper samples

Energy Technology Data Exchange (ETDEWEB)

Andrade, E. [Departamento de Fisica Experimental, Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Apartado Postal 20-364, 01000 Mexico, DF (Mexico)]. E-mail: andrade@fisica.unam.mx; Murillo, G. [Departamento del Acelerador Instituto Nacional de Investigaciones Nucleares Apartado postal 18-1027, 11801 Mexico, DF (Mexico); Policroniades, R. [Departamento del Acelerador Instituto Nacional de Investigaciones Nucleares Apartado postal 18-1027, 11801 Mexico, DF (Mexico); Acosta, L. [Departamento de Fisica Experimental, Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Apartado Postal 20-364, 01000 Mexico, DF (Mexico); Zavala, E.P. [Departamento de Fisica Experimental, Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Apartado Postal 20-364, 01000 Mexico, DF (Mexico); Rocha, M.F. [Escuela Superior de Ingenieria Mecanica y Electrica, IPN, CP 07738 Mexico, DF (Mexico); Centeno, S.A. [Department of Scientific Research, The Metropolitan Museum of Art, 1000 Fifth Avenue, New York, NY 10028 (United States)

2005-10-15

The elemental composition and depth profiles obtained by IBA techniques on some gilded-copper fragments from the Moche site of Loma Negra, in the Piura Valley, on the Northern Coast of Peru are presented in this article. A previous radiocarbon dating of a wooden fragment indicated that Loma Negra was occupied around 295 AD. A PIXE analysis using a 2.6 MeV external proton beam, was used to obtain the concentration of trace elements in the samples. RBS analyses using 2.72 MeV {sup 4}He{sup +} and 12.0 MeV {sup 12}C{sup 3+} were used to obtain the Au, Ag, Cu atomic profiles. NRA with a 1.02 MeV deuteron beam was used to measure the oxygen and carbon concentrations through the {sup 16}O(d,p) {sup 17}O, {sup 16}O(d,{alpha}) {sup 14}N and {sup 12}C(d,p{sub 0}) {sup 13}C reactions.

Temperature profile and water depth collected from BT and XBT casts in the Northwest Atlantic Ocean from SEDCO BP 471 from 03 November 1985 to 23 December 1985 (NODC Accession 8600138)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the SEDCO BP 471 in the Northwest Atlantic Ocean. Data were collected from 03...

Quantitative analysis of oxygen depth distribution by means of deuteron reaction

International Nuclear Information System (INIS)

Dyumin, A.N.; Eremin, V.K.; Konnikov, S.G.

1993-01-01

Experimentally are investigated and realized possibilities for using the reaction for quantitative determination of the depth profiles of the oxygen distribution in HTSC structures in layers up to 10 4 A. It is concluded that in the near-surface layers when profiling the oxygen content is achieved the spatial resolution of 150 A

Junction depth measurement using carrier illumination

International Nuclear Information System (INIS)

Borden, Peter

2001-01-01

Carrier Illumination [trade mark] (CI) is a new method recently developed to meet the need for a non-destructive, high throughput junction depth measurement on patterned wafers. A laser beam creates a quasi-static excess carrier profile in the semiconductor underlying the activated junction. The excess carrier profile is fairly constant below the junction, and drops rapidly in the junction, creating a steep index of refraction gradient at the junction edge. Interference with light reflected from this index gradient provides a signal that is analyzed to determine the junction depth. The paper summarizes evaluation of performance in full NMOS and PMOS process flows, on both bare and patterned wafers. The aims have been to validate (1) performance in the presence of underlying layers typically found at the source/drain (S/D) process steps and (2) measurement on patterned wafers. Correlation of CI measurements to SIMS and transistor drive current are shown. The data were obtained from NMOS structures using As S/D and LDD implants. Correlations to SRP, SIMS and sheet resistance are shown for PMOS structures using B 11 LDD implants. Gage capability measurements are also presented

Novel approach of signal normalization for depth profile of cultural heritage materials

Science.gov (United States)

Syvilay, D.; Detalle, V.; Wilkie-Chancellier, N.; Texier, A.; Martinez, L.; Serfaty, S.

2017-01-01

The investigation of cultural heritage materials is always complex and specific because unique. Materials are most often heterogeneous and organized in several layers such as mural paintings or corrosion products. The characterization of a complete artwork's stratigraphy is actually one of the questions of science conservation. Indeed, the knowledge of these layers allows completing the history of the work of art and a better understanding of alteration processes in order to set up an appropriate conservation action. The LIBS technique has been employed to study the stratigraphy of an artwork thanks to the ablation laser. However, as we know, atomic information could be insufficient to characterize two materials composed by the same based elements. Therefore, an additional molecular analysis, like Raman spectroscopy; is sometimes necessary for a better identification of the material in particular for organic coatings in cultural heritage. We suggest in this study to use Standard Normal Variate (SNV) as a common normalization for different kinds of spectra (LIBS and Raman spectroscopy) combined with a 3D colour representation for stratigraphic identification of the different layers composing the complex material from artwork. So in this investigation, the SNV method will be applied on LIBS and Raman spectra but also on baseline Raman spectra often considering as nuisance. The aim of this study is to demonstrate the versatility of SNV applied on varied spectra like LIBS, Raman spectra as well as the luminescence background. This original work considers the SNV with a 3D colour representation as a probable new perspective for an easy recognition of a structure layered with a direct overview of the depth profile of the artwork.

Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean from 01 December 1987 to 05 January 1988 (NODC Accession 8800015)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIOT LANE in the Northwest Atlantic Ocean. Data were collected from...

Temperature profile and water depth data collected from USCGC HARRIET LANE using BT and XBT casts in the Northwest Atlantic Ocean from 21 July 1988 to 18 August 1988 (NODC Accession 8800256)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIET LANE in the Northwest Atlantic Ocean. Data were collected from...

Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean from 09 March 1988 to 10 March 1988 (NODC Accession 8800094)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC Harriot Lane in the Northwest Atlantic Ocean. Data were collected from...

AES depth profiles in Mo-coated 304L stainless steel achieved by RF-magnetron sputtering and influence of Mo on the corrosion in 3.5% NaCl solution

Energy Technology Data Exchange (ETDEWEB)

Saidi, D. [Département de métallurgie, Division de Technologie du Combustible, Centre de Recherche Nucléaire de Draria CRND, BP. 43 Draria, Alger (Algeria); Zaid, B., E-mail: zaidbachir@yahoo.com [Département de métallurgie, Division de Technologie du Combustible, Centre de Recherche Nucléaire de Draria CRND, BP. 43 Draria, Alger (Algeria); Souami, N. [Centre de Recherche Nucléaire d’Alger CRNA, 2 Bd. Frantz Fanon, Alger (Algeria); Saoula, N. [Division des Milieux Ionisés et Lasers, Centre de Développement des Technologies Avancées CDTA, Cité du 20 août 1956, Baba Hassan, BP n 17, Alger (Algeria); Siad, M. [Centre de Recherche Nucléaire d’Alger CRNA, 2 Bd. Frantz Fanon, Alger (Algeria); Si Ahmed, A. [Im2np, UMR 7334 CNRS, Aix-Marseille Université, 13397 Marseille Cedex 20 (France); Biberian, J.P. [CINaM, UMR 7525 CNRS, Aix Marseille Université, 13288 Marseille Cedex 9 (France)

2015-10-05

Highlights: • Mo coating of 304L stainless steel is achieved via RF-magnetron sputtering. • The AES depth profiles before and after annealing in air (at 973 K) are analyzed. • The corrosions in NaCl solution of bare and Mo-coated samples are compared. • Mo-coated steels exhibit better corrosion behaviors. • The positive action of Mo oxide via its semi-conducting properties is deduced. - Abstract: Molybdenum-coated 304L stainless steel samples, fabricated by RF-magnetron sputtering, are characterized by Auger Electron Spectroscopy (AES) before and after annealing in air at 973 K. The electrochemical parameters of bare and coated materials, in NaCl 3.5% water solution at 298 K, are derived from the potentiodynamic polarization curves. The corrosion current of Mo-coated samples (before and after annealing) is significantly lower than that of its bare counterpart. The information gained from the AES depth profiles leads us to infer that the positive action of molybdenum on the corrosion behavior may be attributed to the changes induced by the semi-conducting properties of Mo oxide in the passive film.

SURFAN, a programme for surface analysis

International Nuclear Information System (INIS)

Negoita, F.; Borcan, C.; Pantelica, D.

1997-01-01

Possible alternatives to Rutherford backscattering spectrometry (RBS) method of material analysis, overcoming the poor sensitivity to light elements of RBS, are the nuclear resonant reaction analysis (NRA) and elastic recoil detection analysis (ERDA). The last one is especially useful in surface and thin film analysis. To simulate the spectra obtained with any of these methods a programme SURFAN was worked out. In comparison with the code RUMP, published by Doolittle, it allows to simply change the charge of the projectile nature, implies no limitation to the energy of incident projectiles and permits the use of any depth profile function. The basic ideas and the structure of SURFAN are presented. Its application to ERDA and RBS methods resulted in important information on the processes implied in special materials obtained by advanced technologies

Temperature profile and water depth collected from XIANG YANG HONG 05 in the South China Sea using BT and XBT casts from 16 November 1986 to 03 December 1986 (NODC Accession 8700009)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth were collected using BT and XBT casts from the XIANG YANG HONG 05 in the South China Sea. Data were collected from 16 November...

Estimating the Rut Depth by UAV Photogrammetry

Directory of Open Access Journals (Sweden)

Paavo Nevalainen

2017-12-01

Full Text Available The rut formation during forest operations is an undesirable phenomenon. A methodology is being proposed to measure the rut depth distribution of a logging site by photogrammetric point clouds produced by unmanned aerial vehicles (UAV. The methodology includes five processing steps that aim at reducing the noise from the surrounding trees and undergrowth for identifying the trails. A canopy height model is produced to focus the point cloud on the open pathway around the forest machine trail. A triangularized ground model is formed by a point cloud filtering method. The ground model is vectorized using the histogram of directed curvatures (HOC method to produce an overall ground visualization. Finally, a manual selection of the trails leads to an automated rut depth profile analysis. The bivariate correlation (Pearson’s r between rut depths measured manually and by UAV photogrammetry is r = 0.67 . The two-class accuracy a of detecting the rut depth exceeding 20 cm is a = 0.65 . There is potential for enabling automated large-scale evaluation of the forestry areas by using autonomous drones and the process described.

Beam profiles in the nonwedged direction for dynamic wedges

International Nuclear Information System (INIS)

Lydon, J.M.; Rykers, K.L.

1996-01-01

One feature of the dynamic wedge is the improved flatness of the beam profile in the nonwedged direction when compared to fixed wedges. Profiles in the nonwedged direction for fixed wedges show a fall-off in dose away from the central axis when compared to the open field profile. This study will show that there is no significant difference between open field profiles and nonwedged direction profiles for dynamically wedged beams. The implications are that the dynamic wedge offers an improved dose distribution in the nonwedged direction that can be modelled by approximating the dynamically wedged field to an open field. This is possible as both the profiles and depth doses of the dynamically wedged fields match those of the open fields, if normalized to d max of the same field size. For treatment planning purposes the effective wedge factor (EWF) provides a normalization factor for the open field depth dose data set. Data will be presented to demonstrate that the EWF shows relatively little variation with depth and can be treated as being independent of field size in the nonwedged direction. (author)

Hydrologic Regulation of Plant Rooting Depth and Vice Versa

Science.gov (United States)

Fan, Y.; Miguez-Macho, G.

2017-12-01

How deep plant roots go and why may hold the answer to several questions regarding the co-evolution of terrestrial life and its environment. In this talk we explore how plant rooting depth responds to the hydrologic plumbing system in the soil/regolith/bedrocks, and vice versa. Through analyzing 2200 root observations of >1000 species along biotic (life form, genus) and abiotic (precipitation, soil, drainage) gradients, we found strong sensitivities of rooting depth to local soil water profiles determined by precipitation infiltration depth from the top (reflecting climate and soil), and groundwater table depth from below (reflecting topography-driven land drainage). In well-drained uplands, rooting depth follows infiltration depth; in waterlogged lowlands, roots stay shallow avoiding oxygen stress below the water table; in between, high productivity and drought can send roots many meters down to groundwater capillary fringe. We explore the global significance of this framework using an inverse model, and the implications to the coevolution of deep roots and the CZ in the Early-Mid Devonian when plants colonized the upland environments.

The coefficient of friction of chrysotile gouge at seismogenic depths

Science.gov (United States)

Moore, Diane E.; Lockner, D.A.; Tanaka, H.; Iwata, K.

2004-01-01

We report new strength data for the serpentine mineral chrysotile at effective normal stresses, ??sn between 40 and 200 MPa in the temperature range 25??-280??C. Overall, the coefficient of friction, ?? (= shear stress/effective normal stress) of water-saturated chrysotile gouge increases both with increasing temperature and ??sn, but the rates vary and the temperature-related increases begin at ???100??C. As a result, a frictional strength minimum (?? = 0.1) occurs at low ??sn at about 100??C. Maximum strength (?? = 0.55) results from a combination of high normal stress and high temperature. The low-strength region is characterized by velocity strengthening and the high-strength region by velocity-weakening behavior. Thoroughly dried chrysotile has ?? = 0.7 and is velocity-weakening. The frictional properties of chrysolite can be explained in its tendency to adsorb large amounts of water that acts as a lubricant during shear. The water is progressively driven off the fiber surfaces with increasing temperature and pressure, causing chrysotile to approach its dry strength. Depth profiles for a chrysotile-lined fault constructed from these data would pass through a strength minimum at ???3 km depth, where sliding should be stable. Below that depth, strength increases rapidly as does the tendency for unstable (seismic) slip. Such a trend would not have been predicted from the room-temperature data. These results therefore illustrate the potential hazards of extrapolating room-temperature friction data to predict fault zone behavior at depth. This depth profile for chrysotile is consistent with the pattern of slip on the Hayward fault, which creeps aseismically at shallow depths but which may be locked below 5 km depth. ?? 2004 by V. H. Winston and Son, Inc. All rights reserved.

The Difference in Translaminar Pressure Gradient and Neuroretinal Rim Area in Glaucoma and Healthy Subjects

Directory of Open Access Journals (Sweden)

Lina Siaudvytyte

2014-01-01

Full Text Available Purpose. To assess differences in translaminar pressure gradient (TPG and neuroretinal rim area (NRA in patients with normal tension glaucoma (NTG, high tension glaucoma (HTG, and healthy controls. Methods. 27 patients with NTG, HTG, and healthy controls were included in the prospective pilot study (each group consisted of 9 patients. Intraocular pressure (IOP, intracranial pressure (ICP, and confocal laser scanning tomography were assessed. TPG was calculated as the difference of IOP minus ICP. ICP was measured using noninvasive two-depth transcranial Doppler device. The level of significance P 0.05. The difference between TPG for healthy (5.4(7.7 mmHg and glaucomatous eyes (NTG 6.3(3.1 mmHg, HTG 15.7(7.7 mmHg was statistically significant (P < 0.001. Higher TPG was correlated with decreased NRA (r = −0.83; P = 0.01 in the NTG group. Conclusion. Translaminar pressure gradient was higher in glaucoma patients. Reduction of NRA was related to higher TPG in NTG patients. Further prospective studies are warranted to investigate the involvement of TPG in glaucoma management.

Cosmogenic 10Be Depth Profile in top 560 m of West Antarctic Ice Sheet Divide Ice Core

Science.gov (United States)

Welten, K. C.; Woodruff, T. E.; Caffee, M. W.; Edwards, R.; McConnell, J. R.; Bisiaux, M. M.; Nishiizumi, K.

2009-12-01

Concentrations of cosmogenic 10Be in polar ice samples are a function of variations in solar activity, geomagnetic field strength, atmospheric mixing and annual snow accumulation rates. The 10Be depth profile in ice cores also provides independent chronological markers to tie Antarctic to Greenland ice cores and to tie Holocene ice cores to the 14C dendrochronology record. We measured 10Be concentrations in 187 samples from depths of 0-560 m of the main WAIS Divide core, WDC06A. The ice samples are typically 1-2 kg and represent 2-4 m of ice, equivalent to an average temporal resolution of ~12 years, based on the preliminary age-depth scale proposed for the WDC core, (McConnell et al., in prep). Be, Al and Cl were separated using ion exchange chromatography techniques and the 10Be concentrations were measured by accelerator mass spectrometry (AMS) at PRIME lab. The 10Be concentrations range from 8.1 to 19.1 x 10^3 at/g, yielding an average of (13.1±2.1) x 10^3 at/g. Adopting an average snow accumulation rate of 20.9 cm weq/yr, as derived from the age-depth scale, this value corresponds to an average 10Be flux of (2.7±0.5) x 10^5 atoms/yr/cm2. This flux is similar to that of the Holocene part of the Siple Dome (Nishiizumi and Finkel, 2007) and Dome Fuji (Horiuchi et al. 2008) ice cores, but ~30% lower than the value of 4.0 x 10^5 atoms/yr/cm2 for GISP2 (Finkel and Nishiizumi, 1997). The periods of low solar activity, known as Oort, Wolf, Spörer, Maunder and Dalton minima, show ~20% higher 10Be concentrations/fluxes than the periods of average solar activity in the last millennium. The maximum 10Be fluxes during some of these periods of low solar activity are up to ~50% higher than average 10Be fluxes, as seen in other polar ice cores, which makes these peaks suitable as chronologic markers. We will compare the 10Be record in the WAIS Divide ice core with that in other Antarctic as well as Greenland ice cores and with the 14C treering record. Acknowledgment. This

Depth-selective X-ray absorption spectroscopy by detection of energy-loss Auger electrons

Energy Technology Data Exchange (ETDEWEB)

Isomura, Noritake, E-mail: isomura@mosk.tytlabs.co.jp [Toyota Central R& D Labs., Inc., 41-1 Yokomichi, Nagakute, Aichi 480-1192 (Japan); Soejima, Narumasa; Iwasaki, Shiro [Toyota Central R& D Labs., Inc., 41-1 Yokomichi, Nagakute, Aichi 480-1192 (Japan); Nomoto, Toyokazu; Murai, Takaaki [Aichi Synchrotron Radiation Center (AichiSR), 250-3 Minamiyamaguchi-cho, Seto, Aichi 489-0965 (Japan); Kimoto, Yasuji [Toyota Central R& D Labs., Inc., 41-1 Yokomichi, Nagakute, Aichi 480-1192 (Japan)

2015-11-15

Graphical abstract: - Highlights: • A unique XAS method is proposed for depth profiling of chemical states. • PEY mode detecting energy-loss electrons enables a variation in the probe depth. • Si K-edge XAS spectra of the Si{sub 3}N{sub 4}/SiO{sub 2}/Si multilayer films have been investigated. • Deeper information was obtained in the spectra measured at larger energy loss. • Probe depth could be changed by the selection of the energy of detected electrons. - Abstract: A unique X-ray absorption spectroscopy (XAS) method is proposed for depth profiling of chemical states in material surfaces. Partial electron yield mode detecting energy-loss Auger electrons, called the inelastic electron yield (IEY) mode, enables a variation in the probe depth. As an example, Si K-edge XAS spectra for a well-defined multilayer sample (Si{sub 3}N{sub 4}/SiO{sub 2}/Si) have been investigated using this method at various kinetic energies. We found that the peaks assigned to the layers from the top layer to the substrate appeared in the spectra in the order of increasing energy loss relative to the Auger electrons. Thus, the probe depth can be changed by the selection of the kinetic energy of the energy loss electrons in IEY-XAS.

Depth-selective X-ray absorption spectroscopy by detection of energy-loss Auger electrons

International Nuclear Information System (INIS)

Isomura, Noritake; Soejima, Narumasa; Iwasaki, Shiro; Nomoto, Toyokazu; Murai, Takaaki; Kimoto, Yasuji

2015-01-01

Graphical abstract: - Highlights: • A unique XAS method is proposed for depth profiling of chemical states. • PEY mode detecting energy-loss electrons enables a variation in the probe depth. • Si K-edge XAS spectra of the Si_3N_4/SiO_2/Si multilayer films have been investigated. • Deeper information was obtained in the spectra measured at larger energy loss. • Probe depth could be changed by the selection of the energy of detected electrons. - Abstract: A unique X-ray absorption spectroscopy (XAS) method is proposed for depth profiling of chemical states in material surfaces. Partial electron yield mode detecting energy-loss Auger electrons, called the inelastic electron yield (IEY) mode, enables a variation in the probe depth. As an example, Si K-edge XAS spectra for a well-defined multilayer sample (Si_3N_4/SiO_2/Si) have been investigated using this method at various kinetic energies. We found that the peaks assigned to the layers from the top layer to the substrate appeared in the spectra in the order of increasing energy loss relative to the Auger electrons. Thus, the probe depth can be changed by the selection of the kinetic energy of the energy loss electrons in IEY-XAS.

Temperature profile and water depth data collected from USS MERRILL using BT and XBT casts in the Indian Ocean and other seas from 17 May 1988 to 01 June 1988 (NODC Accession 8800181)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in Arabian Sea, Indian Ocean, Gulf of Oman, Laccadive Sea, and...

Multiscale analysis of depth-dependent soil penetration resistance in a tropical soil

Science.gov (United States)

Paiva De Lima, Renato; Santos, Djail; Medeiros Bezerra, Joel; Machado Siqueira, Glécio; Paz González, Antonio

2013-04-01

Soil penetration resistance (PR) is widely used because it is linked to basic soil properties; it is correlated to root growth and plant production and is also used as a practical tool for assessing soil compaction and to evaluate the effects of soil management. This study investigates how results from multifractal analysis can quantify key elements of depth-dependent PR profiles and how this information can be used at the field scale. We analyzed multifractality of 50 PR vertical profiles, measured from 0 to 40 cm depth and randomly located on a 6.5 ha sugar cane field in north-eastern Brazil. According to the Soil Taxonomy, the studied soil was classified as an Orthic Podsol The scaling property of each profile was typified by singularity and Rényi spectra estimated by the method of moments. The Hurst exponent was used to parameterize the autocorrelation of the vertical PR data sets. Singularity and Rènyi spectra showed the vertical PR data sets exhibited a well-defined multifractal structure. Hurst exponent values were close to one indicating strong persistence in PR variation with soil depth. Also Hurst exponent was negatively and significantly correlated to coefficient of variation (CV) and skewness of the depth-dependent PR. Multifractal analysis added valuable information to describe the spatial arrangement of depth-dependent penetrometer data sets, which was not taken into account by classical statistical indices. Multifractal parameters were mapped over the experimental field and compared with mean, maximum and minimum values of PR; these maps showed the multifractal approach also may complete information provided by descriptive statistics at the field scale.

Near-surface hydrogen depletion of diamond-like carbon films produced by direct ion deposition

Science.gov (United States)

Markwitz, Andreas; Gupta, Prasanth; Mohr, Berit; Hübner, René; Leveneur, Jerome; Zondervan, Albert; Becker, Hans-Werner

2016-03-01

Amorphous atomically flat diamond-like carbon (DLC) coatings were produced by direct ion deposition using a system based on a Penning ion source, butane precursor gas and post acceleration. Hydrogen depth profiles of the DLC coatings were measured with the 15N R-NRA method using the resonant nuclear reaction 1H(15N, αγ)12C (Eres = 6.385 MeV). The films produced at 3.0-10.5 kV acceleration voltage show two main effects. First, compared to average elemental composition of the film, the near-surface region is hydrogen depleted. The increase of the hydrogen concentration by 3% from the near-surface region towards the bulk is attributed to a growth model which favours the formation of sp2 hybridised carbon rich films in the film formation zone. Secondly, the depth at which the maximum hydrogen concentration is measured increases with acceleration voltage and is proportional to the penetration depth of protons produced by the ion source from the precursor gas. The observed effects are explained by a deposition process that takes into account the contributions of ion species, hydrogen effusion and preferential displacement of atoms during direct ion deposition.

Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the Indian ocean and other seas from 07 January 1989 to 31 January 1989 (NODC Accession 8900034)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the Indian Ocean, South China Sea, Burma Sea, and Malacca of...

Temperature profile and water depth data collected from USS Merrill using BT and XBT casts in the Indian Ocean and other seas from 1988-03-01 to 1988-03-29 (NODC Accession 8800110)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in the Arabian Sea, Gulf of Oman, and Indian Ocean. Data were...

Temperature profile and water depth data collected from USS MERRILL using BT and XBT casts in the Indian Ocean and other seas from 05 April 1988 to 11 April 1988 (NODC Accession 8800140)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS MERRILL in the Indian Ocean, Arabian Sea, and Gulf of Oman. Data were...

{sup 14}N depth profiles in Ti and Ti6Al4V nitrided by various methods, measured by nuclear reaction analysis

Energy Technology Data Exchange (ETDEWEB)

Vickridge, I.; Trompetter, B. [Institute of Geological and Nuclear Sciences Ltd., Lower Hutt (New Zealand); Brown, I. [Industrial Research Ltd, Lower Hutt (New Zealand)

1993-12-31

Titanium alloys have desirable mechanical properties for applications in many areas, but their surface properties, such as friction coefficient, hardness, and wear and corrosion resistance often need to be enhanced. This may be accomplished by forming a thin layer of titanium nitride on the surface, by such methods as thermal nitriding, Ion Beam Assisted Deposition (IBAD), sol-gel technology, or ion implantation. Ion Beam Analysis is assuming an increasing importance for characterising the composition of the outer few microns since it is the only technique that can rapidly yield quantitative concentration depth profiles of {sup 14}N with minimal disruption of the analysed region. 8 refs., 7 figs.

{sup 14}N depth profiles in Ti and Ti6Al4V nitrided by various methods, measured by nuclear reaction analysis

Energy Technology Data Exchange (ETDEWEB)

Vickridge, I; Trompetter, B [Institute of Geological and Nuclear Sciences Ltd., Lower Hutt (New Zealand); Brown, I [Industrial Research Ltd, Lower Hutt (New Zealand)

1994-12-31

Titanium alloys have desirable mechanical properties for applications in many areas, but their surface properties, such as friction coefficient, hardness, and wear and corrosion resistance often need to be enhanced. This may be accomplished by forming a thin layer of titanium nitride on the surface, by such methods as thermal nitriding, Ion Beam Assisted Deposition (IBAD), sol-gel technology, or ion implantation. Ion Beam Analysis is assuming an increasing importance for characterising the composition of the outer few microns since it is the only technique that can rapidly yield quantitative concentration depth profiles of {sup 14}N with minimal disruption of the analysed region. 8 refs., 7 figs.

Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the Indian Ocean and other seas from 02 December 1988 to 28 December 1988 (NODC Accession 8900015)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the Indian Ocean, Arabian Sea, Gulf of Oman, Gulf of Iran, and...

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

Energy Technology Data Exchange (ETDEWEB)

Cumpson, Peter J.; Portoles, Jose F.; Barlow, Anders J.; Sano, Naoko [National EPSRC XPS User' s Service (NEXUS), School of Mechanical and Systems Engineering, Newcastle University, Newcastle upon Tyne, NE1 7RU (United Kingdom)

2013-09-28

Argon Gas Cluster-Ion Beam sources are likely to become widely used on x-ray photoelectron spectroscopy and secondary ion mass spectrometry instruments in the next few years. At typical energies used for sputter depth profiling the average argon atom in the cluster has a kinetic energy comparable with the sputter threshold, meaning that for the first time in practical surface analysis a quantitative model of sputter yields near threshold is needed. We develop a simple equation based on a very simple model. Though greatly simplified it is likely to have realistic limiting behaviour and can be made useful for estimating sputter yields by fitting its three parameters to experimental data. We measure argon cluster-ion sputter yield using a quartz crystal microbalance close to the sputter threshold, for silicon dioxide, poly(methyl methacrylate), and polystyrene and (along with data for gold from the existing literature) perform least-squares fits of our new sputter yield equation to this data. The equation performs well, with smaller residuals than for earlier empirical models, but more importantly it is very easy to use in the design and quantification of sputter depth-profiling experiments.

Correlative study between myopia and ocular relative accommodation

Directory of Open Access Journals (Sweden)

Qiao-Ya Lin

2015-07-01

Full Text Available AIM: To research the characteristics of positive relative accommodation(PRA, negative relative accommodation(NRAand PRA/NRA ratio in myopes. To analyze the relationship among PRA, NRA, PRA/NRA ratio, spherical equivalent degree, years and habbits of wearing glasses, myopia development, and pupil diameter.METHODS: Aretrospective study of ninety eyes in the 180th Hospital of Quanzhou from August 2014 to December 2014. PRA, NRA and PRA/NRA ratio were compared among low, moderate, high myopes and emmetropes. The correlation were analyzed among PRA, NRA, PRA/NRA ratio, spherical equivalent degree, years and habbits of wearing glasses, myopia development and pupil diameter. PRA, NRA, PRA/NRA ratio, years and habbits of wearing glasses and pupil diameter were compared between progress group and non-progress group.RESULTS:(1Without statistical differences in age, sex and intraocular pressure, PRA and PRA/NRA ratio of myopes were lower than emmetropes, while NRA was higher.(2Without statistical differences in age, sex and intraocular pressure, PRA, PRA/NRA ratio and NRA had no statistical differences while years and habbits of wearing glasses had statistical differences among low, moderate, high myopes.(3With longer years of wearing glasses, PRA, PRA/NRA ratio were larger and NRA, pupils were smaller.(4Without statistical differences in age, diopter and intraocular pressure, one group which were not easy to deepen degree had more often-wear-glasses myopia patiens and longer years of wearing glasses, the other group which were easy to deepen degree had more seldom-wear-glasses myopia patiens and shorter years of wearing glasses.CONCLUSION: PRA and PRA/NRA ratio of myopes were lower than emmetropes, while NRA was higher. No correlated relation was detected among PRA, NRA, PRA/NRA ratio, spherical equivalent degree and myopia development. It suggests the onset and progress of myopia are related to many factors. Wearing-glass timely and accurately can

Temperature profile and water depth data collected from DALE and other platforms using BT and XBT casts in the North / South Pacific Ocean from 09 November 1979 to 25 November 1985 (NODC Accession 8900063)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the DALE and other platforms in the North / South Pacific Ocean. Data were...

Effect of pictorial depth cues, binocular disparity cues and motion parallax depth cues on lightness perception in three-dimensional virtual scenes.

Directory of Open Access Journals (Sweden)

Michiteru Kitazaki

2008-09-01

Full Text Available Surface lightness perception is affected by scene interpretation. There is some experimental evidence that perceived lightness under bi-ocular viewing conditions is different from perceived lightness in actual scenes but there are also reports that viewing conditions have little or no effect on perceived color. We investigated how mixes of depth cues affect perception of lightness in three-dimensional rendered scenes containing strong gradients of illumination in depth.Observers viewed a virtual room (4 m width x 5 m height x 17.5 m depth with checkerboard walls and floor. In four conditions, the room was presented with or without binocular disparity (BD depth cues and with or without motion parallax (MP depth cues. In all conditions, observers were asked to adjust the luminance of a comparison surface to match the lightness of test surfaces placed at seven different depths (8.5-17.5 m in the scene. We estimated lightness versus depth profiles in all four depth cue conditions. Even when observers had only pictorial depth cues (no MP, no BD, they partially but significantly discounted the illumination gradient in judging lightness. Adding either MP or BD led to significantly greater discounting and both cues together produced the greatest discounting. The effects of MP and BD were approximately additive. BD had greater influence at near distances than far.These results suggest the surface lightness perception is modulated by three-dimensional perception/interpretation using pictorial, binocular-disparity, and motion-parallax cues additively. We propose a two-stage (2D and 3D processing model for lightness perception.

T1rho mapping of entire femoral cartilage using depth- and angle-dependent analysis

International Nuclear Information System (INIS)

Nozaki, Taiki; Kaneko, Yasuhito; Yu, Hon J.; Yoshioka, Hiroshi; Kaneshiro, Kayleigh; Schwarzkopf, Ran; Hara, Takeshi

2016-01-01

To create and evaluate normalized T1rho profiles of the entire femoral cartilage in healthy subjects with three-dimensional (3D) angle- and depth-dependent analysis. T1rho images of the knee from 20 healthy volunteers were acquired on a 3.0-T unit. Cartilage segmentation of the entire femur was performed slice-by-slice by a board-certified radiologist. The T1rho depth/angle-dependent profile was investigated by partitioning cartilage into superficial and deep layers, and angular segmentation in increments of 4 over the length of segmented cartilage. Average T1rho values were calculated with normalized T1rho profiles. Surface maps and 3D graphs were created. T1rho profiles have regional and depth variations, with no significant magic angle effect. Average T1rho values in the superficial layer of the femoral cartilage were higher than those in the deep layer in most locations (p < 0.05). T1rho values in the deep layer of the weight-bearing portions of the medial and lateral condyles were lower than those of the corresponding non-weight-bearing portions (p < 0.05). Surface maps and 3D graphs demonstrated that cartilage T1rho values were not homogeneous over the entire femur. Normalized T1rho profiles from the entire femoral cartilage will be useful for diagnosing local or early T1rho abnormalities and osteoarthritis in clinical applications. (orig.)

T1rho mapping of entire femoral cartilage using depth- and angle-dependent analysis

Energy Technology Data Exchange (ETDEWEB)

Nozaki, Taiki; Kaneko, Yasuhito; Yu, Hon J.; Yoshioka, Hiroshi [University of California Irvine, Department of Radiological Sciences, Orange, CA (United States); Kaneshiro, Kayleigh [University of California Irvine, School of Medicine, Irvine, CA (United States); Schwarzkopf, Ran [University of California Irvine, Department of Orthopedic Surgery, Irvine, CA (United States); Hara, Takeshi [Gifu University Graduate School of Medicine, Department of Intelligent Image Information, Division of Regeneration and Advanced Medical Sciences, Gifu (Japan)

2016-06-15

To create and evaluate normalized T1rho profiles of the entire femoral cartilage in healthy subjects with three-dimensional (3D) angle- and depth-dependent analysis. T1rho images of the knee from 20 healthy volunteers were acquired on a 3.0-T unit. Cartilage segmentation of the entire femur was performed slice-by-slice by a board-certified radiologist. The T1rho depth/angle-dependent profile was investigated by partitioning cartilage into superficial and deep layers, and angular segmentation in increments of 4 over the length of segmented cartilage. Average T1rho values were calculated with normalized T1rho profiles. Surface maps and 3D graphs were created. T1rho profiles have regional and depth variations, with no significant magic angle effect. Average T1rho values in the superficial layer of the femoral cartilage were higher than those in the deep layer in most locations (p < 0.05). T1rho values in the deep layer of the weight-bearing portions of the medial and lateral condyles were lower than those of the corresponding non-weight-bearing portions (p < 0.05). Surface maps and 3D graphs demonstrated that cartilage T1rho values were not homogeneous over the entire femur. Normalized T1rho profiles from the entire femoral cartilage will be useful for diagnosing local or early T1rho abnormalities and osteoarthritis in clinical applications. (orig.)

Meteoric 10Be in soil profiles - A global meta-analysis

Science.gov (United States)

Graly, Joseph A.; Bierman, Paul R.; Reusser, Lucas J.; Pavich, Milan J.

2010-01-01

In order to assess current understanding of meteoric 10Be dynamics and distribution in terrestrial soils, we assembled a database of all published meteoric 10Be soil depth profiles, including 104 profiles from 27 studies in globally diverse locations, collectively containing 679 individual measurements. This allows for the systematic comparison of meteoric 10Be concentration to other soil characteristics and the comparison of profile depth distributions between geologic settings. Percent clay, 9Be, and dithionite-citrate extracted Al positively correlate to meteoric 10Be in more than half of the soils where they were measured, but the lack of significant correlation in other soils suggests that no one soil factor controls meteoric 10Be distribution with depth. Dithionite-citrate extracted Fe and cation exchange capacity are only weakly correlated to meteoric 10Be. Percent organic carbon and pH are not significantly related to meteoric 10Be concentration when all data are complied.The compilation shows that meteoric 10Be concentration is seldom uniform with depth in a soil profile. In young or rapidly eroding soils, maximum meteoric 10Be concentrations are typically found in the uppermost 20 cm. In older, more slowly eroding soils, the highest meteoric 10Be concentrations are found at depth, usually between 50 and 200 cm. We find that the highest measured meteoric 10Be concentration in a soil profile is an important metric, as both the value and the depth of the maximum meteoric 10Be concentration correlate with the total measured meteoric 10Be inventory of the soil profile.In order to refine the use of meteoric 10Be as an estimator of soil erosion rate, we compare near-surface meteoric 10Be concentrations to total meteoric 10Be soil inventories. These trends are used to calibrate models of meteoric 10Be loss by soil erosion. Erosion rates calculated using this method vary based on the assumed depth and timing of erosional events and on the reference data selected.

Depth to Curie temperature across the central Red Sea from magnetic data using the de-fractal method

Science.gov (United States)

Salem, Ahmed; Green, Chris; Ravat, Dhananjay; Singh, Kumar Hemant; East, Paul; Fairhead, J. Derek; Mogren, Saad; Biegert, Ed

2014-06-01

The central Red Sea rift is considered to be an embryonic ocean. It is characterised by high heat flow, with more than 90% of the heat flow measurements exceeding the world mean and high values extending to the coasts - providing good prospects for geothermal energy resources. In this study, we aim to map the depth to the Curie isotherm (580 °C) in the central Red Sea based on magnetic data. A modified spectral analysis technique, the “de-fractal spectral depth method” is developed and used to estimate the top and bottom boundaries of the magnetised layer. We use a mathematical relationship between the observed power spectrum due to fractal magnetisation and an equivalent random magnetisation power spectrum. The de-fractal approach removes the effect of fractal magnetisation from the observed power spectrum and estimates the parameters of depth to top and depth to bottom of the magnetised layer using iterative forward modelling of the power spectrum. We applied the de-fractal approach to 12 windows of magnetic data along a profile across the central Red Sea from onshore Sudan to onshore Saudi Arabia. The results indicate variable magnetic bottom depths ranging from 8.4 km in the rift axis to about 18.9 km in the marginal areas. Comparison of these depths with published Moho depths, based on seismic refraction constrained 3D inversion of gravity data, showed that the magnetic bottom in the rift area corresponds closely to the Moho, whereas in the margins it is considerably shallower than the Moho. Forward modelling of heat flow data suggests that depth to the Curie isotherm in the centre of the rift is also close to the Moho depth. Thus Curie isotherm depths estimated from magnetic data may well be imaging the depth to the Curie temperature along the whole profile. Geotherms constrained by the interpreted Curie isotherm depths have subsequently been calculated at three points across the rift - indicating the variation in the likely temperature profile with

Temperature profile and water depth data collected from AUSTRALIA STAR and other platforms using XBT casts in the TOGA Area - Atlantic and Pacific Ocean from 05 October 1989 to 21 December 1992 (NODC Accession 9400035)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using XBT casts from the AUSTRALIA STAR and other platforms in the TOGA Area - Atlantic and Pacific Ocean,...

Towards Selective Tidal-Stream Transport for Lagrangian profilers

DEFF Research Database (Denmark)

Jouffroy, Jerome; Zhou, Qiuyang; Zielinski, Oliver

2011-01-01

Autonomous Lagrangian profilers are widely used as measurement and monitoring platforms. In their current mode of operation, the profilers usually drift passively at their parking depth before making a vertical profile to go back to the surface. This paper presents a control strategy to actively...

Depth-time interpolation of feature trends extracted from mobile microelectrode data with kernel functions.

Science.gov (United States)

Wong, Stephen; Hargreaves, Eric L; Baltuch, Gordon H; Jaggi, Jurg L; Danish, Shabbar F

2012-01-01

Microelectrode recording (MER) is necessary for precision localization of target structures such as the subthalamic nucleus during deep brain stimulation (DBS) surgery. Attempts to automate this process have produced quantitative temporal trends (feature activity vs. time) extracted from mobile MER data. Our goal was to evaluate computational methods of generating spatial profiles (feature activity vs. depth) from temporal trends that would decouple automated MER localization from the clinical procedure and enhance functional localization in DBS surgery. We evaluated two methods of interpolation (standard vs. kernel) that generated spatial profiles from temporal trends. We compared interpolated spatial profiles to true spatial profiles that were calculated with depth windows, using correlation coefficient analysis. Excellent approximation of true spatial profiles is achieved by interpolation. Kernel-interpolated spatial profiles produced superior correlation coefficient values at optimal kernel widths (r = 0.932-0.940) compared to standard interpolation (r = 0.891). The choice of kernel function and kernel width resulted in trade-offs in smoothing and resolution. Interpolation of feature activity to create spatial profiles from temporal trends is accurate and can standardize and facilitate MER functional localization of subcortical structures. The methods are computationally efficient, enhancing localization without imposing additional constraints on the MER clinical procedure during DBS surgery. Copyright © 2012 S. Karger AG, Basel.

Commissioning of a medical accelerator photon beam Monte Carlo simulation using wide-field profiles

International Nuclear Information System (INIS)

Pena, J; Franco, L; Gomez, F; Iglesias, A; Lobato, R; Mosquera, J; Pazos, A; Pardo, J; Pombar, M; RodrIguez, A; Sendon, J

2004-01-01

A method for commissioning an EGSnrc Monte Carlo simulation of medical linac photon beams through wide-field lateral profiles at moderate depth in a water phantom is presented. Although depth-dose profiles are commonly used for nominal energy determination, our study shows that they are quite insensitive to energy changes below 0.3 MeV (0.6 MeV) for a 6 MV (15 MV) photon beam. Also, the depth-dose profile dependence on beam radius adds an additional uncertainty in their use for tuning nominal energy. Simulated 40 cm x 40 cm lateral profiles at 5 cm depth in a water phantom show greater sensitivity to both nominal energy and radius. Beam parameters could be determined by comparing only these curves with measured data

Commissioning of a medical accelerator photon beam Monte Carlo simulation using wide-field profiles

Energy Technology Data Exchange (ETDEWEB)

Pena, J [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Franco, L [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Gomez, F [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Iglesias, A [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Lobato, R [Hospital ClInico Universitario de Santiago, Santiago de Compostela (Spain); Mosquera, J [Hospital ClInico Universitario de Santiago, Santiago de Compostela (Spain); Pazos, A [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Pardo, J [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Pombar, M [Hospital ClInico Universitario de Santiago, Santiago de Compostela (Spain); RodrIguez, A [Departamento de Fisica de PartIculas, Facultade de Fisica, 15782 Santiago de Compostela (Spain); Sendon, J [Hospital ClInico Universitario de Santiago, Santiago de Compostela (Spain)

2004-11-07

A method for commissioning an EGSnrc Monte Carlo simulation of medical linac photon beams through wide-field lateral profiles at moderate depth in a water phantom is presented. Although depth-dose profiles are commonly used for nominal energy determination, our study shows that they are quite insensitive to energy changes below 0.3 MeV (0.6 MeV) for a 6 MV (15 MV) photon beam. Also, the depth-dose profile dependence on beam radius adds an additional uncertainty in their use for tuning nominal energy. Simulated 40 cm x 40 cm lateral profiles at 5 cm depth in a water phantom show greater sensitivity to both nominal energy and radius. Beam parameters could be determined by comparing only these curves with measured data.

Atomic emission spectroscopic investigations for determining depth profiles at boride layers on iron materials

International Nuclear Information System (INIS)

Danzer, K.; Marx, G.

1980-01-01

A combination of atomic emission spectroscopic surface analysis and mechanical removement of defined surface areas in layers by grinding yields information about the depth distribution of boron in iron. In addition, the evaluation with the aid of the two-dimensional variance analysis leads to statements on the homogeneous distribution within individual layers at different depth. The results obtained in this way are in agreement with those of other methods

Depth profiling of Pu, 241Am and 137Cs in soils from southern Belarus measured by ICP-MS and alpha and gamma spectrometry.

Science.gov (United States)

Boulyga, Sergei F; Zoriy, Myroslav; Ketterer, Michael E; Becker, J Sabine

2003-08-01

The depth distribution of plutonium, americium, and 137Cs originating from the 1986 accident at the Chernobyl Nuclear Power Plant (NPP) was investigated in several soil profiles in the vicinity from Belarus. The vertical migration of transuranic elements in soils typical of the 30 km relocation area around Chernobyl NPP was studied using inductively coupled plasma mass spectrometry (ICP-MS), alpha spectrometry, and gamma spectrometry. Transuranic concentrations in upper soil layers ranged from 6 x 10(-12) g g(-1) to 6 x 10(-10) g g(-1) for plutonium and from 1.8 x 10(-13) g g(-1) to 1.6 x 10(-11) g g(-1) for americium. These concentrations correspond to specific activities of (239+240)Pu of 24-2400 Bq kg(-1) and specific activity of 241Am of 23-2000 Bq kg(-1), respectively. Transuranics in turf-podzol soil migrate slowly to the deeper soil layers, thus, 80-95%, of radionuclide inventories were present in the 0-3 cm intervals of turf-podzol soils collected in 1994. In peat-marsh soil migration processes occur more rapidly than in turf-podzol and the maximum concentrations are found beneath the soil surface (down to 3-6 cm). The depth distributions of Pu and Am are essentially identical for a given soil profile. (239+240)Pu/137Cs and 241Am/137Cs activity ratios vary by up to a factor of 5 at some sites while smaller variations in these ratios were observed at a site close to Chernobyl, suggesting that 137Cs is dominantly particle associated close to Chernobyl but volatile species of 137Cs are of relatively greater importance at the distant sites.

A temperature profiler

Digital Repository Service at National Institute of Oceanography (India)

Peshwe, V.B.; Desa, E.

An instrument developed for measuring temperature profiles at sea in depth or time scales is described. PC-based programming offers flexibility in setting up the instrument for the mode of operation prior to each cast. A real time clock built...

Regional correlations of VS30 averaged over depths less than and greater than 30 meters

Science.gov (United States)

Boore, David M.; Thompson, Eric M.; Cadet, Héloïse

2011-01-01

Using velocity profiles from sites in Japan, California, Turkey, and Europe, we find that the time-averaged shear-wave velocity to 30 m (VS30), used as a proxy for site amplification in recent ground-motion prediction equations (GMPEs) and building codes, is strongly correlated with average velocities to depths less than 30 m (VSz, with z being the averaging depth). The correlations for sites in Japan (corresponding to the KiK-net network) show that VSz is systematically larger for a given VSz than for profiles from the other regions. The difference largely results from the placement of the KiK-net station locations on rock and rocklike sites, whereas stations in the other regions are generally placed in urban areas underlain by sediments. Using the KiK-net velocity profiles, we provide equations relating VS30 to VSz for z ranging from 5 to 29 m in 1-m increments. These equations (and those for California velocity profiles given in Boore, 2004b) can be used to estimate VS30 from VSz for sites in which velocity profiles do not extend to 30 m. The scatter of the residuals decreases with depth, but, even for an averaging depth of 5 m, a variation in logVS30 of ±1 standard deviation maps into less than a 20% uncertainty in ground motions given by recent GMPEs at short periods. The sensitivity of the ground motions to VS30 uncertainty is considerably larger at long periods (but is less than a factor of 1.2 for averaging depths greater than about 20 m). We also find that VS30 is correlated with VSz for z as great as 400 m for sites of the KiK-net network, providing some justification for using VS30 as a site-response variable for predicting ground motions at periods for which the wavelengths far exceed 30 m.

Temperature profile and water depth data collected from USCGC HARRIOT LANE using BT and XBT casts in the Northwest Atlantic Ocean and Caribbean Sea from 30 April 1988 to 31 May 1988 (NODC Accession 8800173)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USCGC HARRIOT LANE in the Northwest Atlantic Ocean and Caribbean Sea. Data...

Temperature profile and water depth data collected from USS BARBEY using BT and XBT casts in the TOGA Area - Pacific Ocean and other areas from 03 November 1988 to 01 December 1988 (NODC Accession 8800327)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS BARBEY in the TOGA Area - Pacific Ocean, Bay of Bengal, Indian Ocean,...

Profile analysis of microparticles

International Nuclear Information System (INIS)

Konarski, P.; Iwanejko, I.; Mierzejewska, A.

2001-01-01

Depth resolved analyses of several types of microparticles are presented. Particles for secondary ion mass spectrometry (SIMS) depth profile analysis were collected in the working environment of glass plant, steelworks and welding station using eight-stage cascade impactor with particle size range of 0.3 μm to 15 μm. Ion beam sputtering and sample rotation technique allowed to describe morphology i.e. the elemental structure of collected sub-micrometer particles. Also model particles Iriodin 221 (Merck) were depth profiled. The core-shell structure is found for all types of investigated particles. Steelworks particles consist mainly of iron and manganese cores. At the shells of these microparticles: lead, chlorine and fluorine are found. The particles collected in the glass-works consist mainly of lead-zirconium glass cores covered by carbon and copper. Stainless-steel welding particles compose of iron, manganese and chromium cores covered by a shell rich in carbon, chlorine and fluorine. Sample rotation technique applied in SIMS appears to be an effective tool for environmental microparticle morphology studies

The Pearson IV distribution and its application to ion implanted depth profiles

International Nuclear Information System (INIS)

Wilson, R.G.

1980-01-01

The Pearson IV distribution system is analyzed to determine the regions of validity for the values of the moments that produce convex, concave, more pointed than Gaussian, and more flat-topped than Gaussian distributions; the limits beyond which no significant change in distribution is produced; and excluded regions. These regions are illustrated in a figure that can be used to facilitate the determination of the Pearson IV moments for experimental ion implanted depth distributions. Examples are given of Pearson IV distributions to illustrate the effects of the ranges of skewness, kurtosis, and standard deviation, for both more pointed and more flat-topped than Gaussian distributions. A procedure is described for matching experimental ion implanted depth distributions to computer plotted Pearson IV modified Gaussian distributions. A few experimental curves are given to illustrate the different types of Pearson IV curves, and accuracies of moments are discussed. (author)

Area and depth of surfactant-induced corneal injury predicts extent of subsequent ocular responses.

Science.gov (United States)

Jester, J V; Petroll, W M; Bean, J; Parker, R D; Carr, G J; Cavanagh, H D; Maurer, J K

1998-12-01

To correlate area and depth of initial corneal injury induced by surfactants of differing type and irritant properties with corneal responses and outcome in the same animals over time by using in vivo confocal microscopy (CM). Six groups of six adult rabbits were treated with anionic, cationic, and nonionic surfactants that caused different levels of ocular irritation. Test materials included slight irritants: 5% sodium lauryl sulfate (SLS), polyoxyethylene glycol monoalkyl ether (POE), and 5% 3-isotridecyloxypropyl-bis(polyoxyethylene) ammonium chloride (ITDOP); mild irritants: 5% 3-decyloxypropyl-bis(polyoxyethylene) amine (DOP) and sodium linear alkylbenzene sulfonate (LAS); and a moderate irritant: a proprietary detergent (DTRGT). Ten microliters surfactant were directly applied to the cornea of one eye of each rabbit. Ten untreated rabbits served as control subjects. Area and depth of initial injury was determined by using in vivo CM to measure epithelial thickness, epithelial cell size, corneal thickness, and depth of stromal injury in four corneal regions at 3 hours and at day 1. Area and depth of corneal responses to injury were evaluated at various times from days 3 through 35 by macroscopic grading and quantitative confocal microscopy through-focusing (CMTF). In vivo CM revealed corneal injury with slight irritants to be restricted to the epithelium, whereas the mild and moderate irritants caused complete epithelial cell loss with increasing anterior stromal damage: DOP < LAS < DTRGT. With the slight ocular irritants there was little or no change in corneal thickness or the CMTF intensity profiles. Three hours after treatment, mild and moderate ocular irritants caused a significant increase in corneal thickness, which peaked at day 1 with DOP (483.3+/-80.1 microm) and LAS (572.3+/-60.0 microm) and day 3 with DTRGT (601.4+/-68.7 microm); returning to normal (similar to control values) by day 7 with DOP and day 35 with LAS and DTRGT. The CMTF intensity

Temperature profile and water depth data collected from USS JOHN RODGERS using BT and XBT casts in the NE/NW Atlantic Ocean and other seas from 03 August 1988 to 03 October 1988 (NODC Accession 8900041)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS JOHN RODGERS in the Northeast / Northwest Atlantic Ocean, Ionian Sea,...

High Energy Ion Beam Studies of Ion Exchange in a Na2O-Al2O3-SiO2 Glass

International Nuclear Information System (INIS)

Shutthanadan, Vaithiyalingam; Baer, Donald R.; Thevuthasan, Suntharampillai; Adams, Evan M.; Maheswaran, Saravanamuthu; Engelhard, Mark H.; Icenhower, Jonathan P.; McGrail, Bernard P.

2002-01-01

As part of understanding the processes leading to sodium release and ion exchange, the surface and near surface reaction regions on several specimens of a Na2O-Al2O3-SiO2 glass have been examined after exposures to isotopically labeled aqueous solutions. The majority of the analyses describe here have been carried out using energetic ion beam analysis. Rutherford backscattering spectrometry (RBS) has been used to measure the overall glass composition and to determine the profiles and amounts of Na released from the surface. An important part of the ion exchange process is the uptake and incorporation of hydrogen and oxygen in the glass from the solution. To facilitate this analysis, the glasses were exposed to a solution containing 18O and deuterium and analyzed by accelerator based nuclear reaction analysis (NRA). To confirm some of the RBS depth profile data very near the surface, XPS depth profiles were collected on some samples. Although the Na concentration is decreased in the near surface region, it is not totally removed from the outer surface. In this same region, there is also a significant amount of 18O incorporated demonstrating considerable interaction between the water and the glass. Deeper into the material the amounts of deuterium and 18O are more consistent with water or H3O+ diffusion. These results suggest that there exist an outer reaction layer and an inner diffusion controlled layer in the surface region of the reacted glass

Temperature profile and water depth data collected from USS HENRY B. WILSON using BT and XBT casts in the Indian Ocean and other seas from 22 October 1986 to 26 November 1986 (NODC Accession 8800183)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS HENRY B. WILSON in the Indian Ocean, Gulf of Oman, Gulf of Iran, and...

Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material

Science.gov (United States)

Oh, Won Jin; Jang, Jong Shik; Lee, Youn Seoung; Kim, Ansoon; Kim, Kyung Joong

2018-02-01

Quantitative analysis methods of multi-element alloy films were compared. The atomic fractions of Si1-xGex alloy films were measured by depth profiling analysis with secondary ion mass spectrometry (SIMS) and X-ray Photoelectron Spectroscopy (XPS). Intensity-to-composition conversion factor (ICF) was used as a mean to convert the intensities to compositions instead of the relative sensitivity factors. The ICFs were determined from a reference Si1-xGex alloy film by the conventional method, average intensity (AI) method and total number counting (TNC) method. In the case of SIMS, although the atomic fractions measured by oxygen ion beams were not quantitative due to severe matrix effect, the results by cesium ion beam were very quantitative. The quantitative analysis results by SIMS using MCs2+ ions are comparable to the results by XPS. In the case of XPS, the measurement uncertainty was highly improved by the AI method and TNC method.

Characterization of oxide layers on amorphous Mg-based alloys by Auger electron spectroscopy with sputter depth profiling

Energy Technology Data Exchange (ETDEWEB)

Baunack, S.; Wolff, U. [Leibniz-Institut fuer Festkoerper- und Werkstoffforschung Dresden, Postfach 270016, 01171, Dresden (Germany); Subba Rao, R.V. [Indira Ghandi Centre for Atomic Research, 603 102, Kalpakkam, Tamil Nadu (India)

2003-04-01

Amorphous ribbons of Mg-Y-TM-[Ag](TM: Cu, Ni), prepared by melt spinning, were subjected to electrochemical investigations. Oxide layers formed anodically under potentiostatic control in different electrolytes were investigated by AES and sputter depth profiling. Problems and specific features of characterization of the composition of oxide layers and amorphous ternary or quaternary Mg-based alloys have been investigated. In the alloys the Mg(KL{sub 23}L{sub 23}) peak exhibits a different shape compared to that in the pure element. Analysis of the peak of elastically scattered electrons proved the absence of plasmon loss features, characteristic of pure Mg, in the alloy. A different loss feature emerges in Mg(KL{sub 23}L{sub 23}) and Cu(L{sub 23}VV). The system Mg-Y-TM-[Ag] suffers preferential sputtering. Depletion of Mg and enrichment of TM and Y are found. This is attributed mainly to the preferential sputtering of Mg. Thickness and composition of the formed oxide layer depend on the electrochemical treatment. After removing the oxide by sputtering the concentration of the underlying alloy was found to be affected by the treatment. (orig.)

Local atomic structure of Fe/Cr multilayers: Depth-resolved method

Science.gov (United States)

Babanov, Yu. A.; Ponomarev, D. A.; Devyaterikov, D. I.; Salamatov, Yu. A.; Romashev, L. N.; Ustinov, V. V.; Vasin, V. V.; Ageev, A. L.

2017-10-01

A depth-resolved method for the investigation of the local atomic structure by combining data of X-ray reflectivity and angle-resolved EXAFS is proposed. The solution of the problem can be divided into three stages: 1) determination of the element concentration profile with the depth z from X-ray reflectivity data, 2) determination of the X-ray fluorescence emission spectrum of the element i absorption coefficient μia (z,E) as a function of depth and photon energy E using the angle-resolved EXAFS data Iif (E , ϑl) , 3) determination of partial correlation functions gij (z , r) as a function of depth from μi (z , E) . All stages of the proposed method are demonstrated on a model example of a multilayer nanoheterostructure Cr/Fe/Cr/Al2O3. Three partial pair correlation functions are obtained. A modified Levenberg-Marquardt algorithm and a regularization method are applied.

Deuterium behavior in first-wall materials for nuclear fusion

International Nuclear Information System (INIS)

Bernard, E.

2012-01-01

Plasma-wall interactions play an important part while choosing materials for the first wall in future fusion reactors. Moreover, the use of tritium as a fuel will impose safety limits regarding the total amount present in the tokamak. Previous analyses of first-wall samples exposed to fusion plasma highlighted an in-bulk migration of deuterium (as an analog to tritium) in carbon materials. Despite its limited value, this retention is problematic: contrary to co-deposited layers, it seems very unlikely to recover easily the deuterium retained in such a way. Because of the difficult access to in situ samples, most published studies on the subject were carried out using post-mortem sample analysis. In order to access to the dynamic of the phenomenon and come apart potential element redistribution during storage, we set up a bench intended for simultaneous low-energy ion implantation, reproducing the deuterium interaction with first-wall materials, and high-energy micro beam analysis. Nuclear reaction analysis performed at the micrometric scale (μNRA) allows to characterize deuterium repartition profiles in situ. This analysis technique was confirmed to be non-perturbative of the mechanisms studied. We observed on the experimental data set that the material surface (0-1 μm) display a high and nearly constant deuterium content, with a uniform distribution. On the contrary, in-bulk deuterium (1-11 μm) localizes in preferential trapping sites related to the material microstructure. In-bulk deuterium inventory seems to increase with the incident fluence, in spite of the wide data scattering attributed to the structure variation of studied areas. Deuterium saturation at the surface as well as in-depth migration are instantaneous; in-vacuum storage leads to a small deuterium global desorption. Observations made via μNRA were coupled with results from other characterization techniques. X-ray μtomography allowed to identify porosities as the preferential trapping sites

Presentation of a reference material for the spatially resolved hydrogen analytics in near-surface layers by means of nuclear-reaction analysis; Darstellung eines Referenzmaterials fuer die ortsaufgeloeste Wasserstoffanalytik in oberflaechennahen Schichten mittels Kernreaktionsanalyse

Energy Technology Data Exchange (ETDEWEB)

Reinholz, U.

2005-10-03

The object of the thesis is the presentation of the theory of the {sup 15}N-reaction analysis (NRA), the experiemental construction of the corresponding beam pipe at the ion accelerator of the BAM and the evaluation of the measurement results. The aim is the first characterization of a reference material for the H analytics on the base of amorphous silicon (aSi) on a Si[100] substrate. The homogeneity of the aSi:H layers deposited by means of CVD was studied. For this pro substrate for about 30 samples the hydrogen depth profiles were measures, folded by means of a program created within the thesis and subjected to a statistical evaluation. The result were mean value ans standard deviation of the hydrogen concentration as well as an estimator for the contribution of the inhomogeneity to the measurement uncertainty. The stability of the potential reference material was proved by the constancy of result of repeated measurements of the hydrogen concentration during the application of a large dose of {sup 15}N ions. In an international ring experiment the reproducibility of the measurement results was proved. For the characterization of the aSi:H layers beside the NRA the white-light interferometry, ellipsometry, profilometry, and X-ray reflectometry, as well as the IR and Raman spectroscopy were used. The stoichiometry of the applied standard material kapton was checked by means of NMR spectroscopy and CHN analysis.

Comparison of inverse Laplace and numerical inversion methods for obtaining z-depth profiles of diffraction data

International Nuclear Information System (INIS)

Xiaojing Zhu; Predecki, P.; Ballard, B.

1995-01-01

Two different inversion methods, the inverse Laplace method and the linear constrained numerical method, for retrieving the z-profiles of diffraction data from experimentally obtained i-profiles were compared using tests with a known function as the original z-profile. Two different real data situations were simulated to determine the effects of specimen thickness and missing τ-profile data at small τ-values on the retrieved z-profiles. The results indicate that although both methods are able to retrieve the z-profiles in the bulk specimens satisfactorily, the numerical method can be used for thin film samples as well. Missing τ-profile data at small τ values causes error in the retrieved z-profiles with both methods, particularly when the trend of the τ-profile at small τ is significantly changed because of the missing data. 6 refs., 3 figs

Resinas alquídicas altamente ramificadas obtenidas sin compuestos orgánicos volátiles.

Directory of Open Access Journals (Sweden)

Rafael E. Rangel

2018-01-01

Full Text Available Background: Hyperbranched alkyd resins have usually been obtained from hyperbranched polyester polyols (HBP of second, third and fourth generations. Objectives: In this work the influence of the proportion of TOFA on the structural, thermal, and rheological and films properties of hyperbranched alkyd resins (NRA were evaluated. Methodology: In order to obtain the NRA, the respective amount of HBP of fifth generation (HBP1G, tall oil fatty acids (TOFA and p-toluenesulphonic acid (0.1wt%, were taken to the reactor. The temperature was kept at 200 °C. The system was kept under mechanical stirring (200 rpm and the conversion of the reaction was evaluated by measurement of acid value (VA. The molar ratios of HBP:TOFA were as follows; 1:3 (NRA1, 1:4 (NRA2, 1:5 (NRA3 y 1:6 (NRA4. Results: VA of the NRA was lower than that of TOFA, the hydroxyl value (VOH was minor compared to that of HBP1G. This is an indication that the esterification reaction between TOFA and HBP1G was carried out. The reaction conversion for obtaining the conversion to NRA was higher than 90 %. By nuclear magnetic resonance (NMR analysis, the signals of the methylene protons joined to OH groups of the HBP1G were evidenced and decreased in their intensity in the NRA1, due to the reaction between HBP1G and TOFA. The hydrodynamic dimensions of the NRA1, NRA2 and NRA3 were nanometrics. Conclusions: The NRA presented the lowest viscosity. Furthermore all NRA, exhibited OH groups and double bonds, which allow that these materials be employed for obtaining hybrid materials and also as crosslinking agents. The NRA showed good film properties.

Temperature profile and water depth data collected from USS ROBERT G. BRADLEY using BT and XBT casts in the NE/NW Atlantic Ocean and other seas from 03 May 1988 to 31 May 1988 (NODC Accession 8800213)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the USS ROBERT G. BRADLEY in the Northwest / Northeast Atlantic Ocean, Arabian...

A measurement system for vertical seawater profiles close to the air-sea interface

Science.gov (United States)

Sims, Richard P.; Schuster, Ute; Watson, Andrew J.; Yang, Ming Xi; Hopkins, Frances E.; Stephens, John; Bell, Thomas G.

2017-09-01

This paper describes a near-surface ocean profiler, which has been designed to precisely measure vertical gradients in the top 10 m of the ocean. Variations in the depth of seawater collection are minimized when using the profiler compared to conventional CTD/rosette deployments. The profiler consists of a remotely operated winch mounted on a tethered yet free-floating buoy, which is used to raise and lower a small frame housing sensors and inlet tubing. Seawater at the inlet depth is pumped back to the ship for analysis. The profiler can be used to make continuous vertical profiles or to target a series of discrete depths. The profiler has been successfully deployed during wind speeds up to 10 m s-1 and significant wave heights up to 2 m. We demonstrate the potential of the profiler by presenting measured vertical profiles of the trace gases carbon dioxide and dimethylsulfide. Trace gas measurements use an efficient microporous membrane equilibrator to minimize the system response time. The example profiles show vertical gradients in the upper 5 m for temperature, carbon dioxide and dimethylsulfide of 0.15 °C, 4 µatm and 0.4 nM respectively.

Dynamic vertical profiles of peat porewater chemistry in a northern peatland

Science.gov (United States)

Natalie A. Griffiths; Stephen D. Sebestyen

2016-01-01

We measured pH, cations, nutrients, and total organic carbon (TOC) over 3 years to examine weekly to monthly variability in porewater chemistry depth profiles (0–3.0 m) in an ombrotrophic bog in Minnesota, USA. We also compared temporal variation at one location to spatial variation in depth profiles at 16 locations across the bog. Most solutes exhibited large...

Polar measurements on profiles

Energy Technology Data Exchange (ETDEWEB)

Althaus, D.

1985-03-01

Wind tunnel models with a profile depth of t=0.5 m were measured in a laminar wind tunnel by the usual measuring processes. The profile resistance was determined by integration along the width of span. The smooth profiles were examined at Re=0.7/1.0 and 1.5 million. At Re=1.0 million, the position of the changeover points were determined with a stethoscope. Also at this Reynolds number measurements were taken with a trip wire of d=2 mm diameter, directly on the profile nose. The tables contain the co-ordinates of the profiles, the contours, the theoretical speed distributions for 4 different angles of attack, the csub(a)-csub(w) polar measurements and changeover points, and the torque coefficients around the t/4 point. (BR).

Temperature profile and water depth data collected from SEDCO / BP 471 using BT and XBT casts in the East Indian Archipelago and TOGA Area - Pacific Ocean from 14 November 1988 to 20 December 1988 (NODC Accession 8900043)

Data.gov (United States)

National Oceanic and Atmospheric Administration, Department of Commerce — Temperature profile and water depth data were collected using BT and XBT casts from the SEDCO / BP 471 in the East Indian Archipelago. and TOGA Area - Pacific Ocean....

Influence of Annealing on the Depth Microstructure of the Shot Peened Duplex Stainless Steel at Elevated Temperature

Science.gov (United States)

Feng, Qiang; She, Jia; Xiang, Yong; Wu, Xianyun; Wang, Chengxi; Jiang, Chuanhai

The depth profiles of residual stresses and lattice parameters in the surface layers of shot peened duplex stainless steel at elevated temperature were investigated utilizing X-ray diffraction analysis. At each deformation depth, residual stress distributions in both ferrite and austenite were studied by X-ray diffraction stress analysis which is performed on the basis of the sin2ψ method and the lattice parameters were explored by Rietveld method. The results reveal that difference changes of depth residual compressive stress profiles between ferrite and austenite under the same annealing condition are resulted from the diverse coefficient of thermal expansion, dislocation density, etc. for different phases in duplex stainless steel. The relaxations of depth residual stresses in austenite are more obvious than those in ferrite. The lattice parameters decrease in the surface layer with the extending of annealing time, however, they increase along the depth after annealing for 16min. The change of the depth lattice parameters can be ascribed to both thermal expansion and the relaxation of residual stress. The different changes of microstructure at elevated temperature between ferrite and austenite are discussed.

Corneal ablation depth readout of the MEL 80 excimer laser compared to Artemis three-dimensional very high-frequency digital ultrasound stromal measurements.

Science.gov (United States)

Reinstein, Dan Z; Archer, Timothy J; Gobbe, Marine

2010-12-01

To evaluate the accuracy of the ablation depth readout for the MEL 80 excimer laser (Carl Zeiss Meditec). Artemis 1 very high-frequency digital ultrasound measurements were obtained before and at least 3 months after LASIK in 121 eyes (65 patients). The Artemis-measured ablation depth was calculated as the maximum difference in stromal thickness before and after treatment. Laser in situ keratomileusis was performed using the MEL 80 excimer laser and the Hansatome microkeratome (Bausch & Lomb). The Aberration Smart Ablation profile was used in 56 eyes and the Tissue Saving Ablation profile was used in 65 eyes. All ablations were centered on the corneal vertex. Comparative statistics and linear regression analysis were performed between the laser readout ablation depth and Artemis-measured ablation depth. The mean maximum myopic meridian was -6.66±2.40 diopters (D) (range: -1.50 to -10.00 D) for Aberration Smart Ablation-treated eyes and -6.50±2.56 D (range: -1.34 to -11.50 D) for Tissue Saving Ablation-treated eyes. The MEL 80 readout was found to overestimate the Artemis-measured ablation depth by 20±12 μm for Aberration Smart Ablation and by 21±12 μm for Tissue Saving Ablation profiles. The accuracy of ablation depth measurement was improved by using the Artemis stromal thickness profile measurements before and after surgery to exclude epithelial changes. The MEL 80 readout was found to overestimate the achieved ablation depth. The linear regression equations could be used by MEL 80 users to adjust the ablation depth for predicted residual stromal thickness calculations without increasing the risk of ectasia due to excessive keratectomy depth as long as a suitable flap thickness bias is included. Copyright 2010, SLACK Incorporated.

Near-surface hydrogen depletion of diamond-like carbon films produced by direct ion deposition

Energy Technology Data Exchange (ETDEWEB)

Markwitz, Andreas, E-mail: A.Markwitz@gns.cri.nz [GNS Science, Lower Hutt (New Zealand); The MacDiarmid Institute for Advanced Materials and Nanotechnology (New Zealand); Gupta, Prasanth [GNS Science, Lower Hutt (New Zealand); The MacDiarmid Institute for Advanced Materials and Nanotechnology (New Zealand); Mohr, Berit [GNS Science, Lower Hutt (New Zealand); Hübner, René [Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf (Germany); Leveneur, Jerome; Zondervan, Albert [GNS Science, Lower Hutt (New Zealand); Becker, Hans-Werner [RUBION, Ruhr-University Bochum (Germany)

2016-03-15

Amorphous atomically flat diamond-like carbon (DLC) coatings were produced by direct ion deposition using a system based on a Penning ion source, butane precursor gas and post acceleration. Hydrogen depth profiles of the DLC coatings were measured with the 15N R-NRA method using the resonant nuclear reaction {sup 1}H({sup 15}N, αγ){sup 12}C (E{sub res} = 6.385 MeV). The films produced at 3.0–10.5 kV acceleration voltage show two main effects. First, compared to average elemental composition of the film, the near-surface region is hydrogen depleted. The increase of the hydrogen concentration by 3% from the near-surface region towards the bulk is attributed to a growth model which favours the formation of sp{sup 2} hybridised carbon rich films in the film formation zone. Secondly, the depth at which the maximum hydrogen concentration is measured increases with acceleration voltage and is proportional to the penetration depth of protons produced by the ion source from the precursor gas. The observed effects are explained by a deposition process that takes into account the contributions of ion species, hydrogen effusion and preferential displacement of atoms during direct ion deposition.

Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films

Czech Academy of Sciences Publication Activity Database

Aulika, I.; Mergen, S.; Bencan, A.; Zhang, Q.; Dejneka, Alexandr; Kosec, M.; Kundzins, K.; Demarchi, D.; Civera, P.

2013-01-01

Roč. 112, č. 1 (2013), s. 53-58 ISSN 1743-6753 R&D Projects: GA TA ČR TA01010517; GA ČR GAP108/12/1941 Institutional research plan: CEZ:AV0Z10100522 Keywords : compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry Subject RIV: BM - Solid Matter Physics ; Magnetism Impact factor: 1.107, year: 2013

Wear-Induced Changes in FSW Tool Pin Profile: Effect of Process Parameters

Science.gov (United States)

Sahlot, Pankaj; Jha, Kaushal; Dey, G. K.; Arora, Amit

2018-06-01

Friction stir welding (FSW) of high melting point metallic (HMPM) materials has limited application due to tool wear and relatively short tool life. Tool wear changes the profile of the tool pin and adversely affects weld properties. A quantitative understanding of tool wear and tool pin profile is crucial to develop the process for joining of HMPM materials. Here we present a quantitative wear study of H13 steel tool pin profile for FSW of CuCrZr alloy. The tool pin profile is analyzed at multiple traverse distances for welding with various tool rotational and traverse speeds. The results indicate that measured wear depth is small near the pin root and significantly increases towards the tip. Near the pin tip, wear depth increases with increase in tool rotational speed. However, change in wear depth near the pin root is minimal. Wear depth also increases with decrease in tool traverse speeds. Tool pin wear from the bottom results in pin length reduction, which is greater for higher tool rotational speeds, and longer traverse distances. The pin profile changes due to wear and result in root defect for long traverse distance. This quantitative understanding of tool wear would be helpful to estimate tool wear, optimize process parameters, and tool pin shape during FSW of HMPM materials.

Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

Science.gov (United States)

Peters, Katharina; Raupp, Sebastian; Hummel, Helga; Bruns, Michael; Scharfer, Philip; Schabel, Wilhelm

2016-06-01

Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs). Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N'-Di(1-naphthyl)-N,N'-diphenyl-(1,1'-biphenyl)-4,4'-diamine) and BAlq (Bis(8-hdroxy-2methylquinoline)-(4-phenylphenoxy)aluminum), originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

Curvature-insensitive methodology for thermal-wave depth-profilometry in multi-layered curvilinear solids

International Nuclear Information System (INIS)

Liu Liwang; Wang Chinhua; Yuan Xiao; Mandelis, Andreas

2010-01-01

A generalized similarity normalization (SN) methodology for characterizing depth profiles of continuously varying thermophysical properties in curvilinear (cylindrical and spherical) solids is presented. Specifically, the principle and the physical mechanism of the elimination of the surface curvature effect from the overall photothermal signal is introduced based on theoretical models of cylindrical, spherical and flat solids with multi-layer structures. The effects of the relative values of radii of curvature of the curvilinear solid, the thickness of the inhomogeneous surface layer and the measurement azimuthal angle on the validity of the technique are discussed in detail. Experimental reconstructions of thermophysical depth profiles of hardened cylindrical steel rods of various diameters are performed based on both curvilinear theory and the equivalent flat surface theory. The reconstructed results are compared and validated.

Peak position differences observed during XPS sputter depth profiling of the SEI on lithiated and delithiated carbon-based anode material for Li-ion batteries

Energy Technology Data Exchange (ETDEWEB)

Oswald, S., E-mail: s.oswald@ifw-dresden.de; Hoffmann, M.; Zier, M.

2017-04-15

Highlights: • In XPS measurements at graphite anodes for Li-ion batteries specific binding energy variations are observed for the SEI species. • The binding energy variations depend on the charging state of the graphite and not on surface charging effects. • Obviously the presence of elemental Li leads to a potential surface gradient in contact with surface layers. • The energy position of implanted Ar can be used as characteristic feature during sputter depth profiling experiments. - Abstract: The ability of delivering chemical information from peak shift phenomena has ever since made X-ray photoelectron spectroscopy (XPS) an ideal tool for material characterization in Li-ion batteries (LIB). Upon investigation, charging is inevitable as most of the chemical species involved are non-conducting. Thus, the binding energy (BE) scale must be corrected to allow an accurate interpretation of the results. This is usually done using the peak position of the ubiquitous surface carbon contamination detectable for all Li-ion battery relevant materials. We herein report on the occurrence of peak shift phenomena that can be observed when investigating surface layers on graphite anodes using sputter depth-profiling. These shifts, however, are not related to classical static electric charging, but are depending on the state of charge (lithiation) of the anode material. The observations presented are in agreement with previous findings on other Li-containing materials and are obviously caused by the presence of Li in its elemental state. As aging and failure mechanisms in LIBs are closely linked to electrolyte reaction products on electrode surfaces it is of high importance to draw the correct conclusions on their chemical origin from XP spectra. In order to avoid misinterpretation of the BE positions, implanted Ar can be used for identification of relevant peak positions and species involved in the phenomena observed.

A measurement system for vertical seawater profiles close to the air–sea interface

Directory of Open Access Journals (Sweden)

R. P. Sims

2017-09-01

Full Text Available This paper describes a near-surface ocean profiler, which has been designed to precisely measure vertical gradients in the top 10 m of the ocean. Variations in the depth of seawater collection are minimized when using the profiler compared to conventional CTD/rosette deployments. The profiler consists of a remotely operated winch mounted on a tethered yet free-floating buoy, which is used to raise and lower a small frame housing sensors and inlet tubing. Seawater at the inlet depth is pumped back to the ship for analysis. The profiler can be used to make continuous vertical profiles or to target a series of discrete depths. The profiler has been successfully deployed during wind speeds up to 10 m s−1 and significant wave heights up to 2 m. We demonstrate the potential of the profiler by presenting measured vertical profiles of the trace gases carbon dioxide and dimethylsulfide. Trace gas measurements use an efficient microporous membrane equilibrator to minimize the system response time. The example profiles show vertical gradients in the upper 5 m for temperature, carbon dioxide and dimethylsulfide of 0.15 °C, 4 µatm and 0.4 nM respectively.

Elemental depth profiles and plasma etching rates of positive-tone electron beam resists after sequential infiltration synthesis of alumina

Science.gov (United States)

Ozaki, Yuki; Ito, Shunya; Hiroshiba, Nobuya; Nakamura, Takahiro; Nakagawa, Masaru

2018-06-01

By scanning transmission electron microscopy and energy dispersive X-ray spectroscopy (STEM–EDS), we investigated the elemental depth profiles of organic electron beam resist films after the sequential infiltration synthesis (SIS) of inorganic alumina. Although a 40-nm-thick poly(methyl methacrylate) (PMMA) film was entirely hybridized with alumina, an uneven distribution was observed near the interface between the substrate and the resist as well as near the resist surface. The uneven distribution was observed around the center of a 100-nm-thick PMMA film. The thicknesses of the PMMA and CSAR62 resist films decreased almost linearly as functions of plasma etching period. The comparison of etching rate among oxygen reactive ion etching, C3F8 reactive ion beam etching (RIBE), and Ar ion beam milling suggested that the SIS treatment enhanced the etching resistance of the electron beam resists to chemical reactions rather than to ion collisions. We proposed oxygen- and Ar-assisted C3F8 RIBE for the fabrication of silica imprint molds by electron beam lithography.

Investigation and modeling of CPL mask profiles using OCD

Science.gov (United States)

Chen, Hsuan-Chen; Lin, Ren-Hao; Chen, Chien-Cheng; Huang, Cheng-Hsuan; Lien, Ta-Cheng; Chen, Chia-Jen; Lee, Gaston; Lee, Hsin-Chang; Yen, Anthony

2016-05-01

Mask profile of chromeless phase-shifting lithography (CPL) defined by OCD has been investigated. In CPL masks, unbalanced bombardments caused by different ion accelerations lead to the formation of micro-notch structures. A better understanding of micro-notch structures is essential for quality gating of mask processes to improve of CPL mask profiles. By measuring 12 of 16 elements of Mueller matrix, we are able to set up a model to simulate the depth of micro-notch structure profile which shows good correlation with TEM images. Moreover, values of CD, quartz etching depth and side wall angle acquired by OCD are presented and compared with those obtained by SEM, TEM and AFM, respectively.

Public relations

International Nuclear Information System (INIS)

1998-01-01

The Nuclear Regulatory Authority of the Slovak Republic (NRA SR) laid the foundation of a policy of keeping the public informed about the activities and the safety of nuclear installations in the SR already in its origins by opening the NRA Information Centre. The NRA SR issues the Bulletin on NRA SR for domestic and foreign use, the bilingual Annual report on NRA activities for domestic and foreign public - detailed report for the specialists and a version for the Slovak Republic state authorities. On the occasion of the anniversary of the IAEA a special publication on the IAEA was prepared. Forty-nine contributions on NRA national and foreign activities were trans-missed to the Press Agency of the SR (TASR) over the course of 1997. In the journal Safety of Nuclear Energy the column 'Information' periodically carries the briefs on NRA activities. Four essential articles on NRA mission and responsibility in the are of peaceful uses of atomic energy were published in the Newsletter of the Slovak Information Agency (SIA). Contributions on NRA activities and international co-operation are periodically put out in the 'Slovenske elektrarne' Newsletter, the Slovak Nuclear Society Bulletin. Report on the Safety of NPPs in the Slovak Republic is annually published in the Journal European Nuclear Society - Nuclear Europe Worldscan. Some articles on NRA activities were published in the world information agency NucNet. The NRA issued in 1997 four editions of the internal Bulletin on the NRA's national and foreign activities and personnel. Three press conferences were held and six events were arranged in radio broadcasting in 1997

Prediction of Soil Solum Depth Using Topographic Attributes in Some Hilly Land of Koohrang in Central Zagros

Directory of Open Access Journals (Sweden)

A. Mehnatkesh

2016-02-01

Full Text Available Introduction: Soil depth is defined as the depth from the surface to more-or-less consolidated material and can be considered as the most crucial soil indicator, affecting desertification and degradation in disturbed ecosystems. Soil depth varies as a function of many different factors, including slope, land use, curvature, parent material, weathering rate, climate, vegetation cover, upslope contributing area, and lithology. Topography, one of the major soil forming factors, controls various soil properties. Thus, quantitative information on the topographic attributes has been applied in the form of digital terrain models (DTMs. The prediction of soil depth by topographic attributes depends mainly on: i the spatial scale of topographic variation in the area, ii the nature of the processes that are responsible for spatial variation in soil depth, and iii the degree to which terrain-soil relationships have been disturbed by human activities. This study was conducted to explore the relationships of soil depth with topographic attributes in a hilly region of western Iran. Materials and Methods: The study area is located at Koohrang district between 32°20′ to 32°30′ N latitudes and 50°14′ to 50°24′ E longitudes, in Charmahal and Bakhtiari province, western Iran. The field sites with an area of 30,000 ha are located on the hillslopes at about 20% transversal slope. The soils at the site are classified as Typic Calcixerepts, Typic Xerorthents and Calcic Haploxerepts for the representative excavated profiles in summit, shoulder and backslope, respectively. The soils located at footslope and toeslope were classified as Chromic Calcixererts. Measurements were made in twenty representative hillslopes of the studied area. At the selected site, one hundred points were selected using randomly stratified methodology, considering all geomorphic surfaces including summit, shoulder, backslope, footslope and toeslope during sampling. Overall, 100

Distribution of base rock depth estimated from Rayleigh wave measurement by forced vibration tests

International Nuclear Information System (INIS)

Hiroshi Hibino; Toshiro Maeda; Chiaki Yoshimura; Yasuo Uchiyama

2005-01-01

This paper shows an application of Rayleigh wave methods to a real site, which was performed to determine spatial distribution of base rock depth from the ground surface. At a certain site in Sagami Plain in Japan, the base rock depth from surface is assumed to be distributed up to 10 m according to boring investigation. Possible accuracy of the base rock depth distribution has been needed for the pile design and construction. In order to measure Rayleigh wave phase velocity, forced vibration tests were conducted with a 500 N vertical shaker and linear arrays of three vertical sensors situated at several points in two zones around the edges of the site. Then, inversion analysis was carried out for soil profile by genetic algorithm, simulating measured Rayleigh wave phase velocity with the computed counterpart. Distribution of the base rock depth inverted from the analysis was consistent with the roughly estimated inclination of the base rock obtained from the boring tests, that is, the base rock is shallow around edge of the site and gradually inclines towards the center of the site. By the inversion analysis, the depth of base rock was determined as from 5 m to 6 m in the edge of the site, 10 m in the center of the site. The determined distribution of the base rock depth by this method showed good agreement on most of the points where boring investigation were performed. As a result, it was confirmed that the forced vibration tests on the ground by Rayleigh wave methods can be useful as the practical technique for estimating surface soil profiles to a depth of up to 10 m. (authors)

Abundance, diversity and depth distribution of Planctomycetes in northern Sphagnum-dominated wetlands

Directory of Open Access Journals (Sweden)

Svetlana N. Dedysh

2012-01-01

Full Text Available Members of the bacterial phylum Planctomycetes inhabit various aquatic and terrestrial environments. In this study, fluorescence in situ hybridization (FISH was applied to assess the abundance and depth distribution of these bacteria in nine different Sphagnum-dominated wetlands of Northern Russia. Planctomycetes were most abundant in the oxic part of peat bog profiles. The respective cell numbers were in the range 1.1-6.7×107 cells per gram of wet peat, comprising 2 to 14% of total bacterial cells and displaying linear correlation to the peat water pH. Most peatland sites showed a sharp decline of planctomycete abundance with depth, while in two particular sites this decline was followed by a second population maximum in an anoxic part of the bog profile. Oxic peat layers were dominated by representatives of the Isosphaera-Singulisphaera group, while anoxic part of the bog profile was inhabited mostly by Zavarzinella- and Pirellula-like planctomycetes. Phylogenetically related bacteria of the candidate division OP3 were detected in both oxic and anoxic peat with cell densities of 0.6-4.6×106 cells per gram of wet peat.

Reconstruction of Stress and Composition Profiles from X-ray Diffraction Experiments - How to Avoid Ghost Stresses?

DEFF Research Database (Denmark)

Christiansen, Thomas; Somers, Marcel A.J.

2004-01-01

On evaluating lattice strain-depth or stress-depth profiles with X-ray diffraction, the variation of the information depth while combining various tilt angles,psi, in combination with lattice spacing gradients leads to artefacts,so-called ghost or fictitious stresses. X-ray diffraction lattice...... method for the evaluation of stress/strain and composition profiles, while minimising the risk for ghost stresses....

Depth-Dose and LET Distributions of Antiproton Beams in Various Target Materials

DEFF Research Database (Denmark)

Herrmann, Rochus; Olsen, Sune; Petersen, Jørgen B.B.

the annihilation process. Materials We have investigated the impact of substituting the target material on  the depth-dose distribution of pristine and  spread out antiproton beams using the FLUKA Monte Carlo transport program. Classical ICRP targets are compared to water phantoms. In addition, track average...... unrestricted LET is calculated for all configurations. Finally, we investigate which concentrations of gadolinium and boron are needed in a water target in order to observe a significant change in the antiproton depth-dose distribution.  Results Results indicate, that there is no significant change...... in the depth-dose distribution and average LET when substituting the materials. Adding boron and gadolinium up to concentrations of 1 per 1000 atoms to a water phantom, did not change the depth-dose profile nor the average LET. Conclusions  According to our FLUKA calculations, antiproton neutron capture...

Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extraction

International Nuclear Information System (INIS)

Wong, K. M.; Chim, W. K.

2007-01-01

An approach for fast and accurate carrier profiling using deep-depletion analytical modeling of scanning capacitance microscopy (SCM) measurements is shown for an ultrashallow p-n junction with a junction depth of less than 30 nm and a profile steepness of about 3 nm per decade change in carrier concentration. In addition, the analytical model is also used to extract the SCM dopant profiles of three other p-n junction samples with different junction depths and profile steepnesses. The deep-depletion effect arises from rapid changes in the bias applied between the sample and probe tip during SCM measurements. The extracted carrier profile from the model agrees reasonably well with the more accurate carrier profile from inverse modeling and the dopant profile from secondary ion mass spectroscopy measurements

How well Can We Classify SWOT-derived Water Surface Profiles?

Science.gov (United States)

Frasson, R. P. M.; Wei, R.; Picamilh, C.; Durand, M. T.

2015-12-01

The upcoming Surface Water Ocean Topography (SWOT) mission will detect water bodies and measure water surface elevation throughout the globe. Within its continental high resolution mask, SWOT is expected to deliver measurements of river width, water elevation and slope of rivers wider than ~50 m. The definition of river reaches is an integral step of the computation of discharge based on SWOT's observables. As poorly defined reaches can negatively affect the accuracy of discharge estimations, we seek strategies to break up rivers into physically meaningful sections. In the present work, we investigate how accurately we can classify water surface profiles based on simulated SWOT observations. We assume that most river sections can be classified as either M1 (mild slope, with depth larger than the normal depth), or A1 (adverse slope with depth larger than the critical depth). This assumption allows the classification to be based solely on the second derivative of water surface profiles, with convex profiles being classified as A1 and concave profiles as M1. We consider a HEC-RAS model of the Sacramento River as a representation of the true state of the river. We employ the SWOT instrument simulator to generate a synthetic pass of the river, which includes our best estimates of height measurement noise and geolocation errors. We process the resulting point cloud of water surface heights with the RiverObs package, which delineates the river center line and draws the water surface profile. Next, we identify inflection points in the water surface profile and classify the sections between the inflection points. Finally, we compare our limited classification of simulated SWOT-derived water surface profile to the "exact" classification of the modeled Sacramento River. With this exercise, we expect to determine if SWOT observations can be used to find inflection points in water surface profiles, which would bring knowledge of flow regimes into the definition of river reaches.

Depth dependence of the single chamber response function of the I'mRT MatriXX array in a 6 MV photon beam

International Nuclear Information System (INIS)

Alashrah, Saleh

2013-01-01

One of the factors which influence the spatial resolution of a 2D detector array is the size of the single detector, another the transport of the secondary electrons from the walls into the measuring volume. In this study, the single ion chamber dose response function of an I'mRT MatriXX array was determined by comparison between slit beam dose profiles measured with the array and with EBT2 radiochromic film in a solid water-equivalent phantom at a shallow depth of 0.5 cm and at a depth of 5 cm beyond the depth dose maximum for a 6 MV photon beam. The dose response functions were obtained using two methods, the best fit method and the deconvolution method. At the shallow depth, a Lorentz function and at 5 cm depth a Gaussian function, both with the same FWHM of 7.4 mm within limits of uncertainty, were identified as the best suited dose response functions of the 4.5 mm diameter single array chamber. These dose response functions were then tested on various dose profiles whose true shape had been determined with EBT2 film and with the IC03 ionization chamber. By convolving these with the Lorentz kernel (at shallow depth) and the Gaussian kernel (at 5 cm depth) the signal profiles measured with the I'mRT MatriXX array were closely approximated. Thus, the convolution of TPS-calculated dose profiles with these dose response functions can minimize the differences between calculation and measurement which occur due to the limited spatial resolution of the I'mRT MatriXX detector. (orig.)

Public relations

International Nuclear Information System (INIS)

1997-01-01

Nuclear Regulatory Authority of the Slovak Republic (NRA SR) started building up a broad information publicity conception resulting in NRA SR Information Centre establishment in 1995. The Centre provides information on the NRA SR activities. The Authority's speaker provides information about NRA SR domestic and foreign activities for TASR, newspapers, Slovak radio and television. Information on nuclear energy facilities situation is given to state authorities, organizations as well as to domestic and foreign mass-media on request. 41 press releases, 3 radio interviews and 5 television records providing information on some important NRA SR events was worked out in 1996. 4 basic NRA SR document have been presented by the Slovak Information Agency, consequently 3 press-conferences were held. Concerning some less frequent communication activities, NRA SR can present the NRA SR annual report in three versions (for the Slovak Government, for public and detailed report for experts). NRA SR and State Authority for Nuclear Safety of the Czech Republic issue together Nuclear Energy Safety News every two months. NRA SR activities Bulletin started issuing in 1996 3 to 4 volumes per year. Newspaper, radio and television news monitoring is performed for Bratislava and Trnava offices providing interesting papers or important events records and photos of NRA SR visits. Practical experience of the information activities performance in connection with the Authority mission and liability was obtained last year. Methodical and organizational guidelines to adjust the state regulatory authority activities in this field have been prepared

Regional correlations of V s30 and velocities averaged over depths less than and greater than 30 meters

Science.gov (United States)

Boore, D.M.; Thompson, E.M.; Cadet, H.

2011-01-01

Using velocity profiles from sites in Japan, California, Turkey, and Europe, we find that the time-averaged shear-wave velocity to 30 m (V S30), used as a proxy for site amplification in recent ground-motion prediction equations (GMPEs) and building codes, is strongly correlated with average velocities to depths less than 30 m (V Sz, with z being the averaging depth). The correlations for sites in Japan (corresponding to the KiK-net network) show that V S30 is systematically larger for a given V Sz than for profiles from the other regions. The difference largely results from the placement of the KiK-net station locations on rock and rocklike sites, whereas stations in the other regions are generally placed in urban areas underlain by sediments. Using the KiK-net velocity profiles, we provide equations relating V S30 to V Sz for z ranging from 5 to 29 m in 1-m increments. These equations (and those for California velocity profiles given in Boore, 2004b) can be used to estimate V S30 from V Sz for sites in which velocity profiles do not extend to 30 m. The scatter of the residuals decreases with depth, but, even for an averaging depth of 5 m, a variation in log V S30 of 1 standard deviation maps into less than a 20% uncertainty in ground motions given by recent GMPEs at short periods. The sensitivity of the ground motions to V S30 uncertainty is considerably larger at long periods (but is less than a factor of 1.2 for averaging depths greater than about 20 m). We also find that V S30 is correlated with V Sz for z as great as 400 m for sites of the KiK-net network, providing some justification for using V S30 as a site-response variable for predicting ground motions at periods for which the wavelengths far exceed 30 m.

Depth distribution of damage obtained by Rutherford backscattering combined with channeling

International Nuclear Information System (INIS)

Behrisch, R.; Roth, J.

1976-01-01

The different approaches to determine depth distributions of damage in solids by Rutherford backscattering combined with channeling are reviewed. These methods are best applicable for damage introduced by ion bombardment. Most investigations up to now have been done at semiconductors where the ion damage seems to be more suited for analysis by this method than the ion damage in metals. The quantity used for getting depth profiles is mostly the increase in minimum yields in single alignment Rutherford backscattering, while only few measurements have been done at double alignment and at slight misalignment, i.e., the sides of the channeling dips

Highly Resolved Mg/Ca Depth Profiles of Planktic Foraminifer test Walls Using Single shot Measurements of fs-LA-ICPMS

Science.gov (United States)

Jochum, K. P.; Schiebel, R.; Stoll, B.; Weis, U.; Haug, G. H.

2017-12-01

Foraminifers are sensitive archives of changes in climate and marine environment. It has been shown that the Mg/Ca signal is a suitable proxy of seawater temperature, because the incorporation of Mg depends on ambient water temperature. In contrast to most former studies, where this ratio is determined by solution-based bulk analysis of 20 - 30 specimens, we have investigated Mg/Ca in single specimens and single chambers at high resolution. A new fs-200 nm-LA-ICPMS technique was developed for the µm-sized layered calcite shells. To generate depth profiles with a resolution of about 50 nm/shot, we chose a low fluence of about 0.3 Jcm-2 and performed single shot measurements of the double charged 44Ca++ and the single charged 25Mg+ ions together. Precision (RSD) of the Mg/Ca data is about 5 %. Calibration was performed with the carbonate reference material MACS-3 from the USGS. Our results for different species from the Arabian Sea and Caribbean Sea demonstrate that Mg/Ca of different chambers vary and indicate that the foraminifer individuals built their chambers in different water depths and/or experienced seasonal changes in seawater temperature caused, for example, by upwelling (cold) versus stratified (warm) conditions. Typically, the Mg/Ca ratios of the final two chambers of the planktic foraminifer Globorotalia menardii from a sediment core of the Arabian Sea differ by about 5 mmol/mol from earlier chambers (2 mmol/mol) corresponding to seawater temperatures of 28 °C and 18 °C, respectively. In addition, mass fractions of other elements like Sr, Mn, Fe, Ba, and U have been determined with fs-LA-ICPMS using fast line scans, and thus provide further insights in the ecology of foraminifers.

Controlling liquid pool depth in VAR of a 21.6 cm diameter ingot of Alloy 718

Science.gov (United States)

Lopez, Felipe; Beaman, Joseph; Williamson, Rodney; Taleff, Eric; Watt, Trevor

It is believed that the final microstructure in vacuum arc remelted (VAR) ingots is strongly influenced by the molten metal pool profile. Thus, if the pool profile was properly controlled during the melt then defect-free microstructures would be obtained. The recent development of a reduced-order model of VAR solidification allowed the design of a pool depth controller to accomplish this task. The controller used a linear quadratic regulator and a Kalman filter to stabilize the melt pool solidification front under the effect of uncertain process dynamics and noisy measurements. Basic Axisymmetric Remelting (BAR), a high-fidelity VAR ingot model, was used in real time to provide pool depth measurements that were incorporated in the control loop. The controller was tested at Los Alamos National Laboratory in a 21.6 diameter Alloy 718 ingot. Details of the controller design will be presented, along with comparisons to experimentally-measured pool depths.

Implementation of reflectometry as a standard density profile diagnostic on DIII-D

International Nuclear Information System (INIS)

Zeng, L.; Doyle, E. J.; Luce, T. C.; Peebles, W. A.

2001-01-01

The profile reflectometer system on the DIII-D tokamak has been significantly upgraded in order to improve time coverage, data quality, and profile availability. The performance of the reflectometer system, which utilizes continuous frequency modulated (FMCW) radar techniques, has been improved as follows: First, a new PC-based data acquisition system has been installed, providing higher data sampling rates and larger memory depth. The higher sampling rate enables use of faster frequency sweeps of the FMCW microwave source, improving time resolution, and increasing profile accuracy. The larger memory depth enables longer data records, so that profiles can now be obtained throughout 5 s discharges at 100 Hz profile measurement rates, while continuous sampling at 10 MHz is available for 1 s for high time resolution physics studies. Second, an initial automated between-shots profile analysis capability is now available. Third, availability of the profiles to end users has been significantly improved

Centennial- to millennial-scale hard rock erosion rates deduced from luminescence-depth profiles

DEFF Research Database (Denmark)

Sohbati, Reza; Liu, Jinfeng; Jain, Mayank

2018-01-01

to quantify hard rock erosion rates at centennial to millennial timescales. Here we propose a novel technique, based on the solar bleaching of luminescence signals with depth into rock surfaces, to bridge this analytical gap. We apply our technique to glacial and landslide boulders in the Eastern Pamirs...

Microbial Community and Functional Structure Significantly Varied among Distinct Types of Paddy Soils But Responded Differently along Gradients of Soil Depth Layers

Directory of Open Access Journals (Sweden)

Ren Bai

2017-05-01

Full Text Available Paddy rice fields occupy broad agricultural area in China and cover diverse soil types. Microbial community in paddy soils is of great interest since many microorganisms are involved in soil functional processes. In the present study, Illumina Mi-Seq sequencing and functional gene array (GeoChip 4.2 techniques were combined to investigate soil microbial communities and functional gene patterns across the three soil types including an Inceptisol (Binhai, an Oxisol (Leizhou, and an Ultisol (Taoyuan along four profile depths (up to 70 cm in depth in mesocosm incubation columns. Detrended correspondence analysis revealed that distinctly differentiation in microbial community existed among soil types and profile depths, while the manifest variance in functional structure was only observed among soil types and two rice growth stages, but not across profile depths. Along the profile depth within each soil type, Acidobacteria, Chloroflexi, and Firmicutes increased whereas Cyanobacteria, β-proteobacteria, and Verrucomicrobia declined, suggesting their specific ecophysiological properties. Compared to bacterial community, the archaeal community showed a more contrasting pattern with the predominant groups within phyla Euryarchaeota, Thaumarchaeota, and Crenarchaeota largely varying among soil types and depths. Phylogenetic molecular ecological network (pMEN analysis further indicated that the pattern of bacterial and archaeal communities interactions changed with soil depth and the highest modularity of microbial community occurred in top soils, implying a relatively higher system resistance to environmental change compared to communities in deeper soil layers. Meanwhile, microbial communities had higher connectivity in deeper soils in comparison with upper soils, suggesting less microbial interaction in surface soils. Structure equation models were developed and the models indicated that pH was the most representative characteristics of soil type and

Microbial Community and Functional Structure Significantly Varied among Distinct Types of Paddy Soils But Responded Differently along Gradients of Soil Depth Layers.

Science.gov (United States)

Bai, Ren; Wang, Jun-Tao; Deng, Ye; He, Ji-Zheng; Feng, Kai; Zhang, Li-Mei

2017-01-01

Paddy rice fields occupy broad agricultural area in China and cover diverse soil types. Microbial community in paddy soils is of great interest since many microorganisms are involved in soil functional processes. In the present study, Illumina Mi-Seq sequencing and functional gene array (GeoChip 4.2) techniques were combined to investigate soil microbial communities and functional gene patterns across the three soil types including an Inceptisol (Binhai), an Oxisol (Leizhou), and an Ultisol (Taoyuan) along four profile depths (up to 70 cm in depth) in mesocosm incubation columns. Detrended correspondence analysis revealed that distinctly differentiation in microbial community existed among soil types and profile depths, while the manifest variance in functional structure was only observed among soil types and two rice growth stages, but not across profile depths. Along the profile depth within each soil type, Acidobacteria , Chloroflexi , and Firmicutes increased whereas Cyanobacteria , β -proteobacteria , and Verrucomicrobia declined, suggesting their specific ecophysiological properties. Compared to bacterial community, the archaeal community showed a more contrasting pattern with the predominant groups within phyla Euryarchaeota , Thaumarchaeota , and Crenarchaeota largely varying among soil types and depths. Phylogenetic molecular ecological network (pMEN) analysis further indicated that the pattern of bacterial and archaeal communities interactions changed with soil depth and the highest modularity of microbial community occurred in top soils, implying a relatively higher system resistance to environmental change compared to communities in deeper soil layers. Meanwhile, microbial communities had higher connectivity in deeper soils in comparison with upper soils, suggesting less microbial interaction in surface soils. Structure equation models were developed and the models indicated that pH was the most representative characteristics of soil type and

Quantitative analysis of hydrogen and of its isotopes at the surface of the solids; Analyse quantitative de l'hydrogene et de ses isotopes a la surface des solides

Energy Technology Data Exchange (ETDEWEB)

Trocellier, P. [CEA Saclay, Dept. des Materiaux pour le Nucleaire (DEN/DANS/DMN), 91 - Gif-sur-Yvette (France)

2007-07-01

For analyzing the hydrogen isotopes, the nature of the probe which allows to excite the considered material and to give the hydrogen answer is multiple and is supported by various physical principles. The different available techniques are presented and several examples are given. To conclude, it is possible to determine the superficial or volume distribution of hydrogen or of one of its two heavy isotopes in choosing the most physico-chemical method. The choice of the technique to use depends of the wanted performance. In order to simplify, we can associate: 1)the sensitivity with mass spectrometry; 2)the depth resolution with the glow discharge, the SIMS and the resonant nuclear reaction; 3)the studied depth with the accelerated ions beams and the AMS; 4)the distribution image with the electrons stimulated desorption, the beta autoradiography and the ERDA; 5)the quantitative profile with the accelerated ions beams techniques; 6)the isotopic analysis with mass spectrometry and the accelerated ions beams. In order to be sure of the relevance of the measurements result, it is indicated to combine the advantages and the performances of several techniques as SIMS and NRA or FTIR and ERDA for instance. (O.M.)

Quantitative analysis of hydrogen and of its isotopes at the surface of the solids

International Nuclear Information System (INIS)

Trocellier, P.

2007-01-01

For analyzing the hydrogen isotopes, the nature of the probe which allows to excite the considered material and to give the hydrogen answer is multiple and is supported by various physical principles. The different available techniques are presented and several examples are given. To conclude, it is possible to determine the superficial or volume distribution of hydrogen or of one of its two heavy isotopes in choosing the most physico-chemical method. The choice of the technique to use depends of the wanted performance. In order to simplify, we can associate: 1)the sensitivity with mass spectrometry; 2)the depth resolution with the glow discharge, the SIMS and the resonant nuclear reaction; 3)the studied depth with the accelerated ions beams and the AMS; 4)the distribution image with the electrons stimulated desorption, the beta autoradiography and the ERDA; 5)the quantitative profile with the accelerated ions beams techniques; 6)the isotopic analysis with mass spectrometry and the accelerated ions beams. In order to be sure of the relevance of the measurements result, it is indicated to combine the advantages and the performances of several techniques as SIMS and NRA or FTIR and ERDA for instance. (O.M.)

Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams

Energy Technology Data Exchange (ETDEWEB)

Redondo-Cubero, A., E-mail: andres.redondo@uam.es [IPFN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal); Departamento de Física Aplicada y Centro de Micro-Análisis de Materiales, Universidad Autónoma de Madrid, 28049 Madrid (Spain); Corregidor, V. [IPFN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal); Vázquez, L. [Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, 28049 Madrid (Spain); Alves, L.C. [C2TN, Instituto Superior Técnico, Campus Tecnológico e Nuclear, Universidade de Lisboa, 2686-953 Bobadela (Portugal)

2015-04-01

Using an ion microprobe, a comprehensive lateral and in-depth characterization of a single GaN-based high electron mobility transistor is carried out by means of Rutherford backscattering spectrometry (RBS) in combination with particle induced X-ray emission (PIXE). Elemental distribution was obtained for every individual section of the device (wafer, gate and source contact), identifying the basic constituents of the transistor (including the detection of the passivant layer) and checking its homogeneity. A self-consistent analysis of each individual regions of the transistor was carried out with a simultaneous fit of RBS and PIXE spectra with two different beam conditions. Following this approach, the quantification of the atomic content and the layer thicknesses was successfully achieved overcoming the mass-depth ambiguity of certain elements.

The biological pump: Profiles of plankton production and consumption in the upper ocean

Science.gov (United States)

Longhurst, Alan R.; Glen Harrison, W.

The ‘biological pump’ mediates flux of carbon to the interior of the ocean by interctions between the components of the vertically-structured pelagic ecosystem of the photic zone. Chlorophyll profiles are not a simple indicator of autotrophic biomass or production, because of non-linearities in the physiology of cells and preferential vertical distribution of taxa. Profiles of numbers or biomass of heterotrophs do not correspond with profiles of consumption, because of depth-selection (taxa, seasons) for reasons unconnected with feeding. Depths of highest plant biomass, chlorophyll and growth rate coincide when these depths are shallow, but become progressively separated in profiles where they are deeper - so that highest growth rate lies progressively shallower than the chloropyll maximum. It is still uncertain how plant biomass is distributed in deep profiles. Depths of greatest heterotroph biomass (mesozooplankton) are usually close to depths of fastest plant growth rate, and thus lie shallower than the chlorophyll maximum in profiles where this itself is deep. This correlation is functional, and relates to the role of heterotrophs in excreting metabolic wastes (especially ammonia), which may fuel a significant component of integrated algal production, especially in the oligotrophic ocean. Some, but not all faecal material from mesozooplankton of the photic zone appears in vertical flux below the pycnocine, depending on the size of the source organisms, and the degree of vertical mixing above the pycnocline. Diel, but probably not seasonal, vertical migration is significant in the vertical flux of dissolved nitrogen. Regional generalisations of the vertical relations of the main components of the ‘biological pump’ now appear within reach, and an approach is suggested.

Effect of high flux plasma exposure on the micro-structural and -mechanical properties of ITER specification tungsten

Energy Technology Data Exchange (ETDEWEB)

Dubinko, A., E-mail: adubinko@sckcen.be [Institute for Nuclear Material Sciences, SCK-CEN, 2400 Mol (Belgium); Department of Applied Physics, Ghent University, 9000 Ghent (Belgium); Terentyev, D. [Institute for Nuclear Material Sciences, SCK-CEN, 2400 Mol (Belgium); National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, 115409 Moscow (Russian Federation); Bakaeva, A. [Institute for Nuclear Material Sciences, SCK-CEN, 2400 Mol (Belgium); Department of Applied Physics, Ghent University, 9000 Ghent (Belgium); Pardoen, T. [Institute of Mechanics, Materials and Civil Engineering, Université catholique de Louvain, Place Sainte Barbe 2 L5.02.02, 1348 Louvain‐la‐Neuve (Belgium); Zibrov, M. [Department of Applied Physics, Ghent University, 9000 Ghent (Belgium); Max-Planck-Institut für Plasmaphysik, Boltzmannstraße 2, D-85748 Garching (Germany); FOM Institute DIFFER – Dutch Institute for Fundamental Energy Research, De Zaale 20, 5612 AJ Eindhoven (Netherlands); Physik-Department E28, Technische Universität München, James-Franck-Straße 1, D-85748 Garching (Germany); National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Kashirskoe shosse 31, 115409 Moscow (Russian Federation); Morgan, T.W. [FOM Institute DIFFER – Dutch Institute for Fundamental Energy Research, De Zaale 20, 5612 AJ Eindhoven (Netherlands)

2017-02-15

Highlights: • Plasma exposure induces dislocation-dominated microstructure. • The exposure-induced changes in microstructure vanish beyond a depth of 12–15 μm. • Surface hardness after the plasma exposure increases significantly in the sub-surface region of 1.5–3 μm. - Abstract: We have performed a combined study using transmission electron microscopy (TEM), nuclear reaction analysis (NRA) and nano-indentation (NI) techniques to reveal the impact of high flux plasma exposure on the properties of a sub-surface region of the commercially available pure tungsten fabricated following the ITER specification. TEM examination revealed the formation of a dense dislocation network and dislocation tangles, resulting in a strong increase in the dislocation density by at least one order of magnitude as compared to the bulk density. The plasma-induced dislocation microstructure vanishes within a depth of about 10–15 μm from the top of the exposed surface. Surface hardness after the plasma exposure was characterized by NI and was found to increase significantly in the sub-surface region of 1.5–3 μm. That was attributed to the resistance of the plasma-induced dislocation networks and deuterium-induced defects, whose presence within a depth of ∼1 μm was unambiguously detected by the NRA measurements as well.

Depth analysis of mechanically machined flaws on steam generator tubings using multi-parameter algorithm

International Nuclear Information System (INIS)

Nam Gung, Chan; Lee, Yoon Sang; Hwang, Seong Sik; Kim, Hong Pyo

2004-01-01

The eddy current testing (ECT) is a nondestructive technique. It is used for evaluation of material's integrity, especially, steam generator (SG) tubing in nuclear plants, due to their rapid inspection, safe and easy operation. For depth measurement of defects, we prepared Electro Discharge Machined (EDM) notches that have several of defects and applied multi-parameter (MP) algorithm. It is a crack shape estimation program developed in Argonne National Laboratory (ANL). To evaluate the MP algorithm, we compared defect profile with fractography of the defects. In the following sections, we described the basic structure of a computer-aided data analysis algorithm used as means of more accurate and efficient processing of ECT data, and explained the specification of a standard calibration. Finally, we discussed the accuracy of estimated depth profile compared with conventional ECT method

Counter-diffusion biofilms have lower N₂O emissions than co-diffusion biofilms during simultaneous nitrification and denitrification: Insights from depth-profile analysis

DEFF Research Database (Denmark)

Kinh, Co Thi; Suenaga, Toshikazu; Hori, Tomoyuki

2017-01-01

geometries, i.e., a MABR and a conventional biofilm reactor (CBR) employing co-current substrate diffusion geometry, were operated to determine depth profiles of dissolved oxygen (DO), nitrous oxide (N2O), functional gene abundance and microbial community structure. Surficial nitrogen removal rate...... (0.011 ± 0.001 mg N2O-N/L) than that in the CBR (1.38 ± 0.25 mg N2O-N/L), resulting in distinct N2O emission factors (0.0058 ± 0.0005% in the MABR vs. 0.72 ± 0.13% in the CBR). Analysis on local net N2O production and consumption rates unveiled that zones for N2O production and consumption were...

Depth perception: the need to report ocean biogeochemical rates as functions of temperature, not depth

Science.gov (United States)

Brewer, Peter G.; Peltzer, Edward T.

2017-08-01

For over 50 years, ocean scientists have oddly represented ocean oxygen consumption rates as a function of depth but not temperature in most biogeochemical models. This unique tradition or tactic inhibits useful discussion of climate change impacts, where specific and fundamental temperature-dependent terms are required. Tracer-based determinations of oxygen consumption rates in the deep sea are nearly universally reported as a function of depth in spite of their well-known microbial basis. In recent work, we have shown that a carefully determined profile of oxygen consumption rates in the Sargasso Sea can be well represented by a classical Arrhenius function with an activation energy of 86.5 kJ mol-1, leading to a Q10 of 3.63. This indicates that for 2°C warming, we will have a 29% increase in ocean oxygen consumption rates, and for 3°C warming, a 47% increase, potentially leading to large-scale ocean hypoxia should a sufficient amount of organic matter be available to microbes. Here, we show that the same principles apply to a worldwide collation of tracer-based oxygen consumption rate data and that some 95% of ocean oxygen consumption is driven by temperature, not depth, and thus will have a strong climate dependence. The Arrhenius/Eyring equations are no simple panacea and they require a non-equilibrium steady state to exist. Where transient events are in progress, this stricture is not obeyed and we show one such possible example. This article is part of the themed issue 'Ocean ventilation and deoxygenation in a warming world'.

Small field depth dose profile of 6 MV photon beam in a simple air-water heterogeneity combination: A comparison between anisotropic analytical algorithm dose estimation with thermoluminescent dosimeter dose measurement.

Science.gov (United States)

Mandal, Abhijit; Ram, Chhape; Mourya, Ankur; Singh, Navin

2017-01-01

To establish trends of estimation error of dose calculation by anisotropic analytical algorithm (AAA) with respect to dose measured by thermoluminescent dosimeters (TLDs) in air-water heterogeneity for small field size photon. TLDs were irradiated along the central axis of the photon beam in four different solid water phantom geometries using three small field size single beams. The depth dose profiles were estimated using AAA calculation model for each field sizes. The estimated and measured depth dose profiles were compared. The over estimation (OE) within air cavity were dependent on field size (f) and distance (x) from solid water-air interface and formulated as OE = - (0.63 f + 9.40) x2+ (-2.73 f + 58.11) x + (0.06 f2 - 1.42 f + 15.67). In postcavity adjacent point and distal points from the interface have dependence on field size (f) and equations are OE = 0.42 f2 - 8.17 f + 71.63, OE = 0.84 f2 - 1.56 f + 17.57, respectively. The trend of estimation error of AAA dose calculation algorithm with respect to measured value have been formulated throughout the radiation path length along the central axis of 6 MV photon beam in air-water heterogeneity combination for small field size photon beam generated from a 6 MV linear accelerator.

Constraining Basin Depth and Fault Displacement in the Malombe Basin Using Potential Field Methods

Science.gov (United States)

Beresh, S. C. M.; Elifritz, E. A.; Méndez, K.; Johnson, S.; Mynatt, W. G.; Mayle, M.; Atekwana, E. A.; Laó-Dávila, D. A.; Chindandali, P. R. N.; Chisenga, C.; Gondwe, S.; Mkumbwa, M.; Kalaguluka, D.; Kalindekafe, L.; Salima, J.

2017-12-01

The Malombe Basin is part of the Malawi Rift which forms the southern part of the Western Branch of the East African Rift System. At its southern end, the Malawi Rift bifurcates into the Bilila-Mtakataka and Chirobwe-Ntcheu fault systems and the Lake Malombe Rift Basin around the Shire Horst, a competent block under the Nankumba Peninsula. The Malombe Basin is approximately 70km from north to south and 35km at its widest point from east to west, bounded by reversing-polarity border faults. We aim to constrain the depth of the basin to better understand displacement of each border fault. Our work utilizes two east-west gravity profiles across the basin coupled with Source Parameter Imaging (SPI) derived from a high-resolution aeromagnetic survey. The first gravity profile was done across the northern portion of the basin and the second across the southern portion. Gravity and magnetic data will be used to constrain basement depths and the thickness of the sedimentary cover. Additionally, Shuttle Radar Topography Mission (SRTM) data is used to understand the topographic expression of the fault scarps. Estimates for minimum displacement of the border faults on either side of the basin were made by adding the elevation of the scarps to the deepest SPI basement estimates at the basin borders. Our preliminary results using SPI and SRTM data show a minimum displacement of approximately 1.3km for the western border fault; the minimum displacement for the eastern border fault is 740m. However, SPI merely shows the depth to the first significantly magnetic layer in the subsurface, which may or may not be the actual basement layer. Gravimetric readings are based on subsurface density and thus circumvent issues arising from magnetic layers located above the basement; therefore expected results for our work will be to constrain more accurate basin depth by integrating the gravity profiles. Through more accurate basement depth estimates we also gain more accurate displacement

Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

Directory of Open Access Journals (Sweden)

Katharina Peters

2016-06-01

Full Text Available Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs. Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N’-Di(1-naphthyl-N,N’-diphenyl-(1,1’-biphenyl-4,4’-diamine and BAlq (Bis(8-hdroxy-2methylquinoline-(4-phenylphenoxyaluminum, originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

Formation of blade and slot die coated small molecule multilayers for OLED applications studied theoretically and by XPS depth profiling

Energy Technology Data Exchange (ETDEWEB)

Peters, Katharina; Raupp, Sebastian, E-mail: sebastian.raupp@kit.edu; Scharfer, Philip; Schabel, Wilhelm [Institute of Thermal Process Engineering, Thin Film Technology, Karlsruhe Institute of Technology (KIT), Karlsruhe (Germany); Hummel, Helga [Philips Technologie GmbH Innovative Technologies, Aachen (Germany); Bruns, Michael [Institute for Applied Materials and Karlsruhe Nano Micro Facility (KNMF), Karlsruhe Institute of Technology (KIT), Karlsruhe (Germany)

2016-06-15

Slot die coaters especially designed for low material consumption and doctor blades were used to process small molecule solutions for organic light-emitting diodes (OLEDs). Optimum process parameters were developed for the large-scale coating techniques to generate stable single and multiple layers only a few nanometers thick. Achieving a multilayer architecture for solution-processed OLEDs is the most challenging step. X-ray photoelectron spectroscopy sputter depth profiling was performed to determine defined interfaces between coated organic layers. Commercially available small molecules NPB (N,N’-Di(1-naphthyl)-N,N’-diphenyl-(1,1’-biphenyl)-4,4’-diamine) and BAlq (Bis(8-hdroxy-2methylquinoline)-(4-phenylphenoxy)aluminum), originally developed for vacuum deposition, were used as hole, respectively electron transport material. Defined double-layers were processed with both scalable coating methods using the orthogonal solvent approach. The use of non-orthogonal solvents resulted in complete intermixing of the material. The results are explained by calculations of solubilities and simulating drying and diffusion kinetics of the small molecule solutions.

Validation of predicted exponential concentration profiles of chemicals in soils

International Nuclear Information System (INIS)

Hollander, Anne; Baijens, Iris; Ragas, Ad; Huijbregts, Mark; Meent, Dik van de

2007-01-01

Multimedia mass balance models assume well-mixed homogeneous compartments. Particularly for soils, this does not correspond to reality, which results in potentially large uncertainties in estimates of transport fluxes from soils. A theoretically expected exponential decrease model of chemical concentrations with depth has been proposed, but hardly tested against empirical data. In this paper, we explored the correspondence between theoretically predicted soil concentration profiles and 84 field measured profiles. In most cases, chemical concentrations in soils appear to decline exponentially with depth, and values for the chemical specific soil penetration depth (d p ) are predicted within one order of magnitude. Over all, the reliability of multimedia models will improve when they account for depth-dependent soil concentrations, so we recommend to take into account the described theoretical exponential decrease model of chemical concentrations with depth in chemical fate studies. In this model the d p -values should estimated be either based on local conditions or on a fixed d p -value, which we recommend to be 10 cm for chemicals with a log K ow > 3. - Multimedia mass model predictions will improve when taking into account depth dependent soil concentrations